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Sample records for 4h-sic schottky diodes

  1. Whiskerless Schottky diode

    NASA Technical Reports Server (NTRS)

    Bishop, William L. (Inventor); Mcleod, Kathleen A. (Inventor); Mattauch, Robert J. (Inventor)

    1991-01-01

    A Schottky diode for millimeter and submillimeter wave applications is comprised of a multi-layered structure including active layers of gallium arsenide on a semi-insulating gallium arsenide substrate with first and second insulating layers of silicon dioxide on the active layers of gallium arsenide. An ohmic contact pad lays on the silicon dioxide layers. An anode is formed in a window which is in and through the silicon dioxide layers. An elongated contact finger extends from the pad to the anode and a trench, preferably a transverse channel or trench of predetermined width, is formed in the active layers of the diode structure under the contact finger. The channel extends through the active layers to or substantially to the interface of the semi-insulating gallium arsenide substrate and the adjacent gallium arsenide layer which constitutes a buffer layer. Such a structure minimizes the effect of the major source of shunt capacitance by interrupting the current path between the conductive layers beneath the anode contact pad and the ohmic contact. Other embodiments of the diode may substitute various insulating or semi-insulating materials for the silicon dioxide, various semi-conductors for the active layers of gallium arsenide, and other materials for the substrate, which may be insulating or semi-insulating.

  2. Carbon-Nanotube Schottky Diodes

    NASA Technical Reports Server (NTRS)

    Manohara, Harish; Wong, Eric; Schlecht, Erich; Hunt, Brian; Siegel, Peter

    2006-01-01

    Schottky diodes based on semiconducting single-walled carbon nanotubes are being developed as essential components of the next generation of submillimeter-wave sensors and sources. Initial performance predictions have shown that the performance characteristics of these devices can exceed those of the state-of-the-art solid-state Schottky diodes that have been the components of choice for room-temperature submillimeter-wave sensors for more than 50 years. For state-of-the-art Schottky diodes used as detectors at frequencies above a few hundred gigahertz, the inherent parasitic capacitances associated with their semiconductor junction areas and the resistances associated with low electron mobilities limit achievable sensitivity. The performance of such a detector falls off approximately exponentially with frequency above 500 GHz. Moreover, when used as frequency multipliers for generating signals, state-of-the-art solid-state Schottky diodes exhibit extremely low efficiencies, generally putting out only micro-watts of power at frequencies up to 1.5 THz. The shortcomings of the state-of-the-art solid-state Schottky diodes can be overcome by exploiting the unique electronic properties of semiconducting carbon nanotubes. A single-walled carbon nanotube can be metallic or semiconducting, depending on its chirality, and exhibits high electron mobility (recently reported to be approx.= 2x10(exp 5)sq cm/V-s) and low parasitic capacitance. Because of the narrowness of nanotubes, Schottky diodes based on carbon nanotubes have ultra-small junction areas (of the order of a few square nanometers) and consequent junction capacitances of the order of 10(exp -18) F, which translates to cutoff frequency >5 THz. Because the turn-on power levels of these devices are very low (of the order of nano-watts), the input power levels needed for pumping local oscillators containing these devices should be lower than those needed for local oscillators containing state-of-the-art solid

  3. Organic Schottky diode: Characterization of traps

    NASA Astrophysics Data System (ADS)

    Rani, Varsha; Yadav, Sarita; Ghosh, Subhasis

    2015-06-01

    We have demonstrated the formation and characterization of Schottky junction in metal/organic/metal sandwiched devices based on organic molecular semiconductors, using current-voltage (J-V) and capacitance-voltage (C-V) characteristics, in particular how traps affect the device performance. Ideality factor of organic Schottky diode is always greater than unity and increases with decreasing the temperature. Diffusion coefficient has been determined from current density -voltage characteristic in Schottky diodes.

  4. Schottky barrier diode and method thereof

    NASA Technical Reports Server (NTRS)

    Aslam, Shahid (Inventor); Franz, David (Inventor)

    2008-01-01

    Pt/n.sup.-GaN Schottky barrier diodes are disclosed that are particularly suited to serve as ultra-violet sensors operating at wavelengths below 200 nm. The Pt/n.sup.-GaN Schottky barrier diodes have very large active areas, up to 1 cm.sup.2, which exhibit extremely low leakage current at low reverse biases. Very large area Pt/n.sup.-GaN Schottky diodes of sizes 0.25 cm.sup.2 and 1 cm.sup.2 have been fabricated from n.sup.-/n.sup.+ GaN epitaxial layers grown by vapor phase epitaxy on single crystal c-plane sapphire, which showed leakage currents of 14 pA and 2.7 nA, respectively for the 0.25 cm.sup.2 and 1 cm.sup.2 diodes both configured at a 0.5V reverse bias.

  5. Polycrystalline Diamond Schottky Diodes and Their Applications.

    NASA Astrophysics Data System (ADS)

    Zhao, Ganming

    In this work, four-hot-filament CVD techniques for in situ boron doped diamond synthesis on silicon substrates were extensively studied. A novel tungsten filament shape and arrangement used to obtain large-area, uniform, boron doped polycrystalline diamond thin films. Both the experimental results and radiative heat transfer analysis showed that this technique improved the uniformity of the substrate temperature. XRD, Raman and SEM studies indicate that large area, uniform, high quality polycrystalline diamond films were obtained. Schottky diodes were fabricated by either sputter deposition of silver or thermal evaporation of aluminum or gold, on boron doped diamond thin films. High forward current density and a high forward-to-reverse current ratio were exhibited by silver on diamond Schottky diodes. Schottky barrier heights and the majority carrier concentrations of both aluminum and gold contacted diodes were determined from the C-V measurements. Furthermore, a novel theoretical C-V-f analysis of deep level boron doped diamond Schottky diodes was performed. The analytical results agree well with the experimental results. Compressive stress was found to have a large effect on the forward biased I-V characteristics of the diamond Schottky diodes, whereas the effect on the reverse biased characteristics was relatively small. The stress effect on the forward biased diamond Schottky diode was attributed to piezojunction and piezoresistance effects. The measured force sensitivity of the diode was as high as 0.75 V/N at 1 mA forward bias. This result shows that CVD diamond device has potential for mechanical transducer applications. The quantitative photoresponse characteristics of the diodes were studied in the spectral range of 300 -1050 nm. Semi-transparent gold contacts were used for better photoresponse. Quantum efficiency as high as 50% was obtained at 500 nm, when a reverse bias of over 1 volt was applied. The Schottky barrier heights between either gold or

  6. An alternative methodology in Schottky diode physics

    NASA Astrophysics Data System (ADS)

    Mitra, J.; Feng, L.; Peñate-Quesada, L.; Dawson, P.

    2015-06-01

    The fabrication and electrical characterization of Schottky junction diodes have been extensively researched for three-quarters of a century since the original work of Schottky in 1938. This study breaks from the highly standardized regime of such research and provides an alternative methodology that prompts novel, more efficient applications of the adroit Schottky junction in areas such as chemical and thermal sensing. The core departure from standard Schottky diode configuration is that the metal electrode is of comparable or higher resistance than the underlying semiconductor. Further, complete electrical characterization is accomplished through recording four-probe resistance-temperature (RD-T) characteristics of the device, where electrical sourcing and sensing is done only via the metal electrode and not directly through the semiconductor. Importantly, this results in probing a nominally unbiased junction while eliminating the need for an Ohmic contact to the semiconductor. The characteristic RD-T plot shows two distinct regions of high (metal) and low (semiconductor) resistances at low and high temperatures, respectively, connected by a cross-over region of width, ΔT, within which there is a large negative temperature coefficient of resistance. The RD-T characteristic is highly sensitive to the Schottky barrier height; consequently, at a fixed temperature, RD responds appreciably to small changes in barrier height such as that induced by absorption of a chemical species (e.g., H2) at the interface. A theoretical model is developed to simulate the RD-T data and applied to Pd/p-Si and Pt/p-Si Schottky diodes with a range of metal electrode resistance. The analysis gives near-perfect fits to the experimental RD-T characteristics, yielding the junction properties as fit parameters. The modelling not only helps elucidate the underlying physics but also helps to comprehend the parameter space essential for the discussed applications. Although the primary regime

  7. Schottky diodes from 2D germanane

    NASA Astrophysics Data System (ADS)

    Sahoo, Nanda Gopal; Esteves, Richard J.; Punetha, Vinay Deep; Pestov, Dmitry; Arachchige, Indika U.; McLeskey, James T.

    2016-07-01

    We report on the fabrication and characterization of a Schottky diode made using 2D germanane (hydrogenated germanene). When compared to germanium, the 2D structure has higher electron mobility, an optimal band-gap, and exceptional stability making germanane an outstanding candidate for a variety of opto-electronic devices. One-atom-thick sheets of hydrogenated puckered germanium atoms have been synthesized from a CaGe2 framework via intercalation and characterized by XRD, Raman, and FTIR techniques. The material was then used to fabricate Schottky diodes by suspending the germanane in benzonitrile and drop-casting it onto interdigitated metal electrodes. The devices demonstrate significant rectifying behavior and the outstanding potential of this material.

  8. SiC-Based Schottky Diode Gas Sensors

    NASA Technical Reports Server (NTRS)

    Hunter, Gary W.; Neudeck, Philip G.; Chen, Liang-Yu; Knight, Dak; Liu, Chung-Chiun; Wu, Quing-Hai

    1997-01-01

    Silicon carbide based Schottky diode gas sensors are being developed for high temperature applications such as emission measurements. Two different types of gas sensitive diodes will be discussed in this paper. By varying the structure of the diode, one can affect the diode stability as well as the diode sensitivity to various gases. It is concluded that the ability of SiC to operate as a high temperature semiconductor significantly enhances the versatility of the Schottky diode gas sensing structure and will potentially allow the fabrication of a SiC-based gas sensor arrays for versatile high temperature gas sensing applications.

  9. Self-Aligned Guard Rings For Schottky-Barrier Diodes

    NASA Technical Reports Server (NTRS)

    Lin, True-Lon

    1990-01-01

    Proposed self-aligned guard ring increases active area of Schottky-barrier infrared detector. Concept developed for silicide Schottky-barrier diodes in which platinum silicide or iridium silicide Schottky-contacts provide cutoff wavelengths of about 6 or 10 micrometers. Grid of silicon dioxide doped with phosphorus etched on silicon wafer, and phosphorus from grid diffused into substrate, creating n-type guard rings. Silicide layers formed in open areas of grid. Overlap of guard rings and silicide layers small.

  10. Laterally stacked Schottky diodes for infrared sensor applications

    NASA Technical Reports Server (NTRS)

    Lin, True-Lon (Inventor)

    1991-01-01

    Laterally stacked Schottky diodes for infrared sensor applications are fabricated utilizing porous silicon having pores. A Schottky metal contract is formed in the pores, such as by electroplating. The sensors may be integrated with silicon circuits on the same chip with a high quantum efficiency, which is ideal for IR focal plane array applications due to uniformity and reproducibility.

  11. Development and fabrication of improved Schottky power diodes

    NASA Technical Reports Server (NTRS)

    Cordes, L. F.; Garfinkel, M.; Taft, E. A.

    1975-01-01

    Reproducible methods for the fabrication of silicon Schottky diodes have been developed for tungsten, aluminum, conventional platinum silicide, and low temperature platinum silicide. Barrier heights and barrier lowering under reverse bias have been measured, permitting the accurate prediction of forward and reverse diode characteristics. Processing procedures have been developed that permit the fabrication of large area (about 1 sq cm) mesageometry power Schottky diodes with forward and reverse characteristics that approach theoretical values. A theoretical analysis of the operation of bridge rectifier circuits has been performed, which indicates the ranges of frequency and voltage for which Schottky rectifiers are preferred to p-n junctions. Power Schottky rectifiers have been fabricated and tested for voltage ratings up to 140 volts.

  12. Enhancement in performance of polycarbazole-graphene nanocomposite Schottky diode

    SciTech Connect

    Pandey, Rajiv K.; Singh, Arun Kumar; Prakash, Rajiv

    2013-12-15

    We report formation of polycarbazole (PCz)–graphene nanocomposite over indium tin oxide (ITO) coated glass substrate using electrochemical technique for fabrication of high performance Schottky diodes. The synthesized nanocomposite is characterized before fabrication of devices for confirmation of uniform distribution of graphene nanosheets in the polymer matrix. Pure PCz and PCz-graphene nanocomposites based Schottky diodes are fabricated of configuration Al/PCz/ITO and Al/PCz-graphene nanocomposite/ITO, respectively. The current density–voltage (J-V) characteristics and diode performance parameters (such as the ideality factor, barrier height, and reverse saturation current density) are compared under ambient condition. Al/PCz-graphene nanocomposite/ITO device exhibits better ideality factor in comparison to the device formed using pure PCz. It is also observed that the Al/PCz-graphene nanocomposite/ITO device shows large forward current density and low turn on voltage in comparison to Al/PCz/ITO device.

  13. The millimeter wave super-Schottky diode detector

    NASA Technical Reports Server (NTRS)

    Silver, A. H.; Pedersen, R. J.; Mccoll, M.; Dickman, R. L.; Wilson, W. J.

    1981-01-01

    The 31 and 92 GHz measurements of the superconductor-Schottky diode extended to millimeter wavelengths by a redesign of the semiconductor interface are reported. Diodes were fabricated by pulse electroplating Pb on 2 x 10 to the 19th/cu cm p-Ga-As etched with HCl; a thin Au overplate is deposited to protect the Pb film from degradation and to improve its lifetime. The noise performance was almost ideal at 31 and 92 GHz; it was concluded that this diode is a quantum-limited-detector at 31 GHz, with excessive parasitic losses at 92 GHz.

  14. Junction barrier Schottky diodes in 6H SiC

    NASA Astrophysics Data System (ADS)

    Zetterling, Carl-Mikael; Dahlquist, Fanny; Lundberg, Nils; Östling, Mikael; Rottner, Kurt; Ramberg, Lennart

    1998-09-01

    Junction barrier Schottky (JBS) diodes in 6H SiC have been fabricated and characterised electrically. This device, demonstrated in silicon technology, has the advantage of a low forward voltage drop comparable to that of Schottky diodes, as well as a high blocking voltage and low reverse leakage current of a pn junction. This is especially attractive for wide bandgap materials such as SiC in which pn junctions have a large forward voltage drop. The devices were capable of blocking up to 1100 V with a leakage current density of 0.15 A cm -2, limited by the leakage when the drift region was fully depleted, or breakdown of the SiC material itself. The forward conduction was limited by an on-resistance of 20 mΩ cm 2, resulting in forward voltage drops of 2.6 V at 100 A cm -2.

  15. Radiation hardness of n-GaN schottky diodes

    SciTech Connect

    Lebedev, A. A. Belov, S. V.; Mynbaeva, M. G.; Strel’chuk, A. M.; Bogdanova, E. V.; Makarov, Yu. N.; Usikov, A. S.; Kurin, S. Yu.; Barash, I. S.; Roenkov, A. D.; Kozlovski, V. V.

    2015-10-15

    Schottky-barrier diodes with a diameter of ∼10 µm are fabricated on n-GaN epitaxial films grown by hydride vapor-phase epitaxy (HVPE) on sapphire substrates. The changes in the parameters of the diodes under irradiation with 15 MeV protons are studied. The carrier removal rate was found to be 130–145 cm{sup –1}. The linear nature of the dependence N = f(D) (N is the carrier concentration, and D, the irradiation dose) shows that compensation of the material is associated with transitions of electrons from shallow donors to deep acceptor levels which are related to primary radiation defects.

  16. Process for preparing schottky diode contacts with predetermined barrier heights

    DOEpatents

    Chang, Y. Austin; Jan, Chia-Hong; Chen, Chia-Ping

    1996-01-01

    A process is provided for producing a Schottky diode having a preselected barrier height .phi..sub.Bn. The substrate is preferably n-GaAs, the metallic contact is derived from a starting alloy of the Formula [.SIGMA.M.sub..delta. ](Al.sub.x Ga.sub.1-x) wherein: .SIGMA.M is a moiety which consists of at least one M, and when more than one M is present, each M is different, M is a Group VIII metal selected from the group consisting of nickel, cobalt, ruthenium, rhodium, indium and platinum, .delta. is a stoichiometric coefficient whose total value in any given .SIGMA.M moiety is 1, and x is a positive number between 0 and 1 (that is, x ranges from greater than 0 to less than 1). Also, the starting alloy is capable of forming with the substrate a two phase equilibrium reciprocal system of the binary alloy mixture [.SIGMA.M.sub..delta. ]Ga-[.SIGMA.M.sub..delta. ]Al-AlAs-GaAs. When members of an alloy subclass within this Formula are each preliminarily correlated with the barrier height .phi..sub.Bn of a contact producable therewith, then Schottky diodes of predetermined barrier heights are producable by sputtering and annealing. Further provided are the product Schottky diodes that are produced according to this process.

  17. Additional electric field in real trench MOS barrier Schottky diode

    NASA Astrophysics Data System (ADS)

    Mamedov, R. K.; Aslanova, A. R.

    2016-04-01

    In real trench MOS barrier Schottky diode (TMBS diode) additional electric field (AEF) the whole is formed in the near contact region of the semiconductor and its propagation space is limited with the barrier metal and the metallic electrodes of MOS structures. Effective potential barrier height TMBS diode is formed via resulting electric field of superposition AEF and electric field of space charge region (SCR) semiconductor. The dependence of the resulting electric field intensity of the distance towards the inside the semiconductor is nonlinear and characterized by a peak at a certain distance from the interface. The thickness of the SCR in TMBS diode becomes equal to the trench depth. Force and energy parameters of the AEF, and thus resulting electric field in the SCR region, become dependent on the geometric design parameters TMBS diode. The forward I-V characteristic TMBS diode is described by the thermionic emission theory as in conventional flat Scottky diode, and in the reverse bias, current is virtually absent at initial voltage, appears abruptly at a certain critical voltage.

  18. Carbon nanotube Schottky diodes using Ti-Schottky and Pt-Ohmic contacts for high frequency applications.

    PubMed

    Manohara, Harish M; Wong, Eric W; Schlecht, Erich; Hunt, Brian D; Siegel, Peter H

    2005-07-01

    We have demonstrated Schottky diodes using semiconducting single-walled nanotubes (s-SWNTs) with titanium Schottky and platinum Ohmic contacts for high-frequency applications. The diodes are fabricated using angled evaporation of dissimilar metal contacts over an s-SWNT. The devices demonstrate rectifying behavior with large reverse bias breakdown voltages of greater than -15 V. To decrease the series resistance, multiple SWNTs are grown in parallel in a single device, and the metallic tubes are burnt-out selectively. At low biases these diodes showed ideality factors in the range of 1.5 to 1.9. Modeling of these diodes as direct detectors at room temperature at 2.5 terahertz (THz) frequency indicates noise equivalent powers (NEP) potentially comparable to that of the state-of-the-art gallium arsenide solid-state Schottky diodes, in the range of 10(-13) W/ radical Hz. PMID:16178259

  19. Carbon nanotube Schottky diodes using Ti-Schottky and Pt-ohmic contacts for high frequency applications

    NASA Technical Reports Server (NTRS)

    Manohara, Harish M.; Wong, Eric W.; Schlecht, Erich; Hunt, Brian D.; Siegel, Peter H.

    2005-01-01

    We have demonstrated Schottky diodes using semiconducting single-walled nanotubes (s-SWNTs) with titanium Schottky and platinum Ohmic contacts for high-frequency applications. The diodes are fabricated using angled evaporation of dissimilar metal contacts over an s-SWNT. The devices demonstrate rectifying behavior with large reverse bias breakdown voltages of greater than 15 V. To decrease the series resistance, multiple SWNTs are grown in parallel in a single device, and the metallic tubes are burnt-out selectively. At low biases these diodes showed ideality factors in the range of 1.5 to 1.9. Modeling of these diodes as direct detectors at room temperature at 2.5 terahertz (THz) frequency indicates noise equivalent powers (NEP) potentially comparable to that of the state-of-the-art gallium arsenide solid-state Schottky diodes, in the range of 10-13 W(square root)xHz.

  20. Diamond Schottky diodes with ideality factors close to 1

    SciTech Connect

    Fiori, A. Teraji, T. Koide, Y.

    2014-09-29

    The stabilization by vacuum annealing of tungsten carbide/p-diamond Schottky barrier diodes (SBDs) has been investigated. The Schottky barrier height (ϕ{sub B}) and ideality factor (n), at high temperature, were consistently estimated by employing a vertical SBD structure. An exponential drop of ϕ{sub B} in time at 600 K and its stabilization at 1.46 eV after 90 min were reported. The lowest n among SBDs examined was close to 1.0 at 600 K. A linear relation between ϕ{sub B} and n in a statistical electrical characterization suggests a ϕ{sub B} inhomogeneity.

  1. Nickel-gallium arsenide high-voltage power Schottky diodes

    NASA Astrophysics Data System (ADS)

    Ashkinazi, G.; Hadas, Tz.; Meyler, B.; Nathan, M.; Zolotarevski, L.; Zolotarevski, O.

    1993-01-01

    A power GaAs Schottky diode (SD) with a chemically deposited Ni barrier was designed, fabricated and tested. The diode has a reverse breakdown voltage VBR of 140 V, forward voltage drop VF (at 50 A/cm 2) of 0.7 V at 23°C, 0.5 V at 150°C and 0.3 V at 250°C, and reverse leakage current densities jR (at -50 V) of 0.1 μA/cm 2 at 23°C and 1 mA/cm 2 at 150°C. Calculated forward and reverse I- V characteristics using a simple self-consistent computer model are in good agreement with measured values. Calculated characteristics of a silicon SD with identical structure parameters, using the same model, show much poorer VBR, VF and jR values. The theoretical maximum value of VBR is physically limited by the largest allowed VF. For a V Fof ⋍1.6 V, V BR.maxis ⋍200 V in Si and ⋍800 simple technology allows manufacturing of large area GaAs Schottky diodes with average currents up to V in GaAs SDs. Our relatively 100 A.

  2. Metal silicide/poly-Si Schottky diodes for uncooled microbolometers

    PubMed Central

    2013-01-01

    Nickel silicide Schottky diodes formed on polycrystalline Si 〈P〉 films are proposed as temperature sensors of monolithic uncooled microbolometer infrared focal plane arrays. The structure and composition of nickel silicide/polycrystalline silicon films synthesized in a low-temperature process are examined by means of transmission electron microscopy. The Ni silicide is identified as a multi-phase compound composed of 20% to 40% of Ni3Si, 30% to 60% of Ni2Si, and 10% to 30% of NiSi with probable minor content of NiSi2 at the silicide/poly-Si interface. Rectification ratios of the Schottky diodes vary from about 100 to about 20 for the temperature increasing from 22℃ to 70℃; they exceed 1,000 at 80 K. A barrier of around 0.95 eV is found to control the photovoltage spectra at room temperature. A set of barriers is observed in photo-electromotive force spectra at 80 K and attributed to the Ni silicide/poly-Si interface. Absolute values of temperature coefficients of voltage and current are found to vary from 0.3%℃ to 0.6%/℃ for forward bias and around 2.5%/℃ for reverse bias of the diodes. PMID:23594606

  3. Schottky barrier parameters and low frequency noise characteristics of graphene-germanium Schottky barrier diode

    NASA Astrophysics Data System (ADS)

    Khurelbaatar, Zagarzusem; Kil, Yeon-Ho; Shim, Kyu-Hwan; Cho, Hyunjin; Kim, Myung-Jong; Lee, Sung-Nam; Jeong, Jae-chan; Hong, Hyobong; Choi, Chel-Jong

    2016-03-01

    We investigated the electrical properties of chemical vapor deposition-grown monolayer graphene/n-type germanium (Ge) Schottky barrier diodes (SBD) using current-voltage (I-V) characteristics and low frequency noise measurements. The Schottky barrier parameters of graphene/n-type Ge SBDs, such as Schottky barrier height (VB), ideality factor (n), and series resistance (Rs), were extracted using the forward I-V and Cheung's methods. The VB and n extracted from the forward ln(I)-V plot were found to be 0.63 eV and 1.78, respectively. In contrast, from Cheung method, the VB and n were calculated to be 0.53 eV and 1.76, respectively. Such a discrepancy between the values of VB calculated from the forward I-V and Cheung's methods indicated a deviation from the ideal thermionic emission of graphene/n-type Ge SBD associated with the voltage drop across graphene. The low frequency noise measurements performed at the frequencies in the range of 10 Hz-1 kHz showed that the graphene/n-type Ge SBD had 1/f γ frequency dependence, with γ ranging from 1.09 to 1.12, regardless of applied forward biases. Similar to forward-biased SBDs operating in the thermionic emission mode, the current noise power spectral density of graphene/n-type Ge SBD was linearly proportional to the forward current.

  4. Zr/oxidized diamond interface for high power Schottky diodes

    SciTech Connect

    Traoré, A. Muret, P.; Fiori, A.; Eon, D.; Gheeraert, E.; Pernot, J.

    2014-02-03

    High forward current density of 10{sup 3} A/cm{sup 2} (at 6 V) and a breakdown field larger than 7.7 MV/cm for diamond diodes with a pseudo-vertical architecture, are demonstrated. The power figure of merit is above 244 MW/cm{sup 2} and the relative standard deviation of the reverse current density over 83 diodes is 10% with a mean value of 10{sup −9} A/cm{sup 2}. These results are obtained with zirconium as Schottky contacts on the oxygenated (100) oriented surface of a stack comprising an optimized lightly boron doped diamond layer on a heavily boron doped one, epitaxially grown on a Ib substrate. The origin of such performances are discussed.

  5. Development and fabrication of improved Schottky power diodes, phases I and II

    NASA Technical Reports Server (NTRS)

    Cordes, L. F.; Garfinkle, M.; Taft, E. A.

    1974-01-01

    Reproducible methods for the fabrication of silicon Schottky diodes were developed for the metals tungsten, aluminum, conventional platinum silicide and low temperature platinum silicide. Barrier heights and barrier lowering were measured permitting the accurate prediction of ideal forward and reverse diode performance. Processing procedures were developed which permit the fabrication of large area (approximately 1 sqcm) mesa-geometry power Schottky diodes with forward and reverse characteristics that approach theoretical values.

  6. A Schottky/2-DEG varactor diode for millimeter and submillimeter wave multiplier applications

    NASA Technical Reports Server (NTRS)

    Peatman, W. C. B.; Crowe, Thomas W.; Shur, M.; Gelmont, B.

    1992-01-01

    A new Schottky diode is investigated for use as a multiplier element in the millimeter and submillimeter wavelength regions. The new diode is based on the Schottky contact at the edge of a 2-dimensional electron gas (2-DEG). As a negative voltage is applied to the Schottky contact, the depletion layer between the Schottky contact and the 2-DEG expands and the junction capacitance decreases, resulting in a nonlinear capacitance-voltage characteristic. In this paper, we outline the theory, design, fabrication, and evaluation of the new device. Recent results include devices having cutoff frequencies of 1 THz and above. Preliminary multiplier results are also presented.

  7. Tension assisted metal transfer of graphene for Schottky diodes onto wafer scale substrates.

    PubMed

    Lee, Jooho; Lee, Su Chan; Kim, Yongsung; Heo, Jinseong; Lee, Kiyoung; Lee, Dongwook; Kim, Jaekwan; Lee, Sunghee; Lee, Chang Seung; Nam, Min Sik; Jun, Seong Chan

    2016-02-19

    We developed an effective graphene transfer method for graphene/silicon Schottky diodes on a wafer as large as 6 inches. Graphene grown on a large scale substrate was passivated and sealed with a gold layer, protecting graphene from any possible contaminant and keeping good electrical contact. The Au/graphene was transferred by the tension-assisted transfer process without polymer residues. The gold film itself was used directly as the electrodes of a Schottky diode. We demonstrated wafer-scale integration of graphene/silicon Schottky diode using the proposed transfer process. The transmission electron microscopy analysis and relatively low ideality factor of the diodes indicated fewer defects on the interface than those obtained using the conventional poly(methyl methacrylate)-assisted transfer method. We further demonstrated gas sensors as an application of graphene Schottky diodes. PMID:26789103

  8. Tension assisted metal transfer of graphene for Schottky diodes onto wafer scale substrates

    NASA Astrophysics Data System (ADS)

    Lee, Jooho; Lee, Su Chan; Kim, Yongsung; Heo, Jinseong; Lee, Kiyoung; Lee, Dongwook; Kim, Jaekwan; Lee, Sunghee; Lee, Chang Seung; Nam, Min Sik; Jun, Seong Chan

    2016-02-01

    We developed an effective graphene transfer method for graphene/silicon Schottky diodes on a wafer as large as 6 inches. Graphene grown on a large scale substrate was passivated and sealed with a gold layer, protecting graphene from any possible contaminant and keeping good electrical contact. The Au/graphene was transferred by the tension-assisted transfer process without polymer residues. The gold film itself was used directly as the electrodes of a Schottky diode. We demonstrated wafer-scale integration of graphene/silicon Schottky diode using the proposed transfer process. The transmission electron microscopy analysis and relatively low ideality factor of the diodes indicated fewer defects on the interface than those obtained using the conventional poly(methyl methacrylate)-assisted transfer method. We further demonstrated gas sensors as an application of graphene Schottky diodes.

  9. Investigation on a radiation tolerant betavoltaic battery based on Schottky barrier diode.

    PubMed

    Liu, Yebing; Hu, Rui; Yang, Yuqing; Wang, Guanquan; Luo, Shunzhong; Liu, Ning

    2012-03-01

    An Au-Si Schottky barrier diode was studied as the energy conversion device of betavoltaic batteries. Its electrical performance under radiation of Ni-63 and H-3 sources and radiation degradation under Am-241 were investigated and compared with those of the p-n junction. The results show that the Schottky diode had a higher I(sc) and harder radiation tolerance but lower V(oc) than the p-n junction. The results indicated that the Schottky diode can be a promising candidate for energy conversion of betavoltaic batteries. PMID:22119560

  10. Temperature dependent simulation of diamond depleted Schottky PIN diodes

    NASA Astrophysics Data System (ADS)

    Hathwar, Raghuraj; Dutta, Maitreya; Koeck, Franz A. M.; Nemanich, Robert J.; Chowdhury, Srabanti; Goodnick, Stephen M.

    2016-06-01

    Diamond is considered as an ideal material for high field and high power devices due to its high breakdown field, high lightly doped carrier mobility, and high thermal conductivity. The modeling and simulation of diamond devices are therefore important to predict the performances of diamond based devices. In this context, we use Silvaco® Atlas, a drift-diffusion based commercial software, to model diamond based power devices. The models used in Atlas were modified to account for both variable range and nearest neighbor hopping transport in the impurity bands associated with high activation energies for boron doped and phosphorus doped diamond. The models were fit to experimentally reported resistivity data over a wide range of doping concentrations and temperatures. We compare to recent data on depleted diamond Schottky PIN diodes demonstrating low turn-on voltages and high reverse breakdown voltages, which could be useful for high power rectifying applications due to the low turn-on voltage enabling high forward current densities. Three dimensional simulations of the depleted Schottky PIN diamond devices were performed and the results are verified with experimental data at different operating temperatures

  11. Graphene-Based Reversible Nano-Switch/Sensor Schottky Diode

    NASA Technical Reports Server (NTRS)

    Miranda, Felix A.; Meador, Michael A.; Theofylaktos, Onoufrios; Pinto, Nicholas J.; Mueller, Carl H.; Santos-Perez, Javier

    2010-01-01

    This proof-of-concept device consists of a thin film of graphene deposited on an electrodized doped silicon wafer. The graphene film acts as a conductive path between a gold electrode deposited on top of a silicon dioxide layer and the reversible side of the silicon wafer, so as to form a Schottky diode. By virtue of the two-dimensional nature of graphene, this device has extreme sensitivity to different gaseous species, thereby serving as a building block for a volatile species sensor, with the attribute of having reversibility properties. That is, the sensor cycles between active and passive sensing states in response to the presence or absence of the gaseous species.

  12. Electrical characterization of MEH-PPV based Schottky diodes

    NASA Astrophysics Data System (ADS)

    Nimith, K. M.; Satyanarayan, M. N.; Umesh, G.

    2016-05-01

    MEH-PPV Schottky diodes with and without Poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT-PSS) have been fabricated and characterized. The highlight of this work is that all the fabrication and characterization steps had been carried out in the ambient conditions and the device fabrication was done without any UV-Ozone surface treatment of ITO anodes. Current Density-Voltage characteristics shows that the addition of hole injection layer (HIL) enhances the charge injection into the polymer layer by reducing the energy barrier across the Indium Tin Oxide (ITO)-Organic interface. The rectification ratio increases to 2.21 from 0.76 at 5V for multilayer devices compared to single layer devices. Further we investigated the effect of an alkali metal fluoride (LiF) by inserting a thin layer in between the organic layer and Aluminum (Al) cathode. The results of these investigations will be discussed in detail.

  13. Electron transport and barrier inhomogeneities in palladium silicide Schottky diodes

    NASA Astrophysics Data System (ADS)

    Chand, S.; Kumar, J.

    The current-voltage (I-V) characteristics of Schottky diodes, prepared by deposition of palladium film on to a n/n+ silicon wafer held at 573 K, are measured over a temperature range 37-307 K and analyzed in terms of thermionic emission-diffusion (TED) theory by incorporating the concept of barrier inhomogeneities through a Gaussian distribution function. The process adopted is shown to yield an ideal Schottky diode with a near constant barrier height of 0.734 V and ideality factor 1.05 in the temperature interval 215-307 K. Below 215 K, both the barrier height (φbo) and the ideality factor (η) exhibit abnormal temperature dependence and are explained by invoking two sets of Gaussian distributions of barrier heights at 84-215 K and 37-84 K. Further, it is demonstrated that the forward bias makes the Gaussian distribution dynamic so that the mean fluctuates (i.e., increases or decreases depending on whether its voltage coefficient is positive or negative) and the standard deviation decreases progressively, i.e., the barrier homogenizes temporarily. The changes occur in such a way that the apparent barrier height at any bias is always higher than at zero-bias. Finally, it is pointed out that the presence of single/multiple distributions can be ascertained and the values of respective parameters deduced from the φap vs. 1/T plot itself. Also, the inverse ideality factor versus inverse temperature plot provides bias coefficients of the mean barrier height and standard deviation of the distribution function.

  14. 4H-SiC junction-barrier Schottky diodes with high forward current densities

    NASA Astrophysics Data System (ADS)

    Tone, Kiyoshi; Zhao, Jian H.; Weiner, Maurice; Pan, Menghan

    2001-07-01

    4H-SiC junction-barrier Schottky (JBS) diodes blocking 1000 V have been fabricated. I-V characteristics have been evaluated at room temperature and 255 °C in comparison with the Schottky barrier (SB) and pin diodes fabricated on the same wafer. While the low reverse leakage confirms the functioning of JBS, the high forward current densities of 630 and 210 A cm-2 at 4.0 V at room temperature and 255 °C, respectively, with only ~20% reduction from those of the SB diodes, clearly demonstrate that the SiC JBS diodes can be fabricated with acceptable sacrifice in the forward current capacities.

  15. Effect of mechanical stress on current-voltage characteristics of thin film polycrystalline diamond Schottky diodes

    SciTech Connect

    Zhao, G.; Charlson, E.M.; Charlson, E.J.; Stacy, T.; Meese, J.M. ); Popovici, G.; Prelas, M. )

    1993-02-15

    Schottky diodes utilized for mechanical stress effect studies were fabricated using aluminum contacts to polycrystalline diamond thin films grown by a hot-filament-assisted chemical vapor deposition process. Compressive stress was found to have a large effect on the forward biased current-voltage characteristics of the diode, whereas the effect on the reverse biased characteristics was relatively small. This stress effect on the forward biased diamond Schottky diode was attributed to piezojunction and piezoresistance effects that dominated the diode current-voltage characteristics in the small and large bias regions, respectively. At a large constant forward bias current, a good linear relationship between output voltage and applied force was observed for force of less than 10 N, as predicted by the piezoresistance effect. The measured force sensitivity of the diode was as high as 0.75 V/N at 1 mA forward bias. Compared to either silicon or germanium junction diodes and tunnel diodes, polycrystalline diamond Schottky diodes not only are very stress sensitive but also have good linearity. This study shows polycrystalline diamond Schottky diodes have potential as mechanical sensors.

  16. Questions of the analysis of millimeter-wave frequency converters on diodes with a Schottky barrier

    NASA Technical Reports Server (NTRS)

    Bordonskiy, G. S.

    1977-01-01

    Millimeter-wave frequency converters on a diode with a Schottky barrier were analyzed. The analysis includes investigation of the effect of the variable capacitance of the diode's elements on the frequency converters. Specifically, the transmission, impedance, and noise characteristics of the frequency converters were examined.

  17. GaAs Schottky barrier varactor diodes for submillimeter wavelength power generation

    NASA Technical Reports Server (NTRS)

    Crowe, T. W.; Peatman, W. C. B.; Winkler, E.

    1991-01-01

    The development of GaAs Schottky barrier diodes for frequencies well into the submillimeter wavelength range is discussed. These devices have the highest cutoff frequencies yet obtained for varactor diodes and have produced sufficient output power to drive Schottky mixers at frequencies as high as 640 GHz. The fundamental design tradeoff between cutoff frequency and capacitance modulation is explored. As the doping density is increased and the anode diameter is reduced, the dynamic cutoff frequency increases, reaching a maximum of roughly 5 THz. It is concluded that the maximum output frequency from harmonic multipliers based on standard GaAs varactor diodes will be about 1 THz.

  18. Minority carrier injection and current–voltage characteristics of Schottky diodes at high injection level

    NASA Astrophysics Data System (ADS)

    Mnatsakanov, Tigran T.; Levinshtein, Michael E.; Tandoev, Alexey G.; Yurkov, Sergey N.; Palmour, John W.

    2016-07-01

    Transport phenomena in Schottky diodes are analyzed at high injection levels of minority carriers. It is shown that the correct description of these phenomena requires that the mode of diffusion stimulated by the quasi-neutral drift (DSQD) should be considered. An analytical expression for current-voltage characteristics of a Schottky diode at high injection levels is derived. The expression predicts a seemingly paradoxical result: the higher the base doping level, the higher the voltage drop across a diode at the same current density. The analytical results are confirmed by computer simulations. The results may be important for analyses of SiC Junction Barrier Schottky (JBS) diodes at very high current densities (surge current mode).

  19. Electrical properties of silicon schottky diodes containing metal films of various compositions

    SciTech Connect

    Pashaev, I. G.

    2013-06-15

    Au{sub x}Ti{sub 100{sub -}} {sub x}/n-Si Schottky diodes are fabricated and studied; in addition, the electrical properties of diodes containing metal films with varying composition (x = 0, 14, 30, 38, 60, 80, and 100) are also studied. Using X-ray phase analysis, it is established that the film of Au{sub 38}Ti{sub 62} composition has the amorphous structure, while the remaining films Au{sub x}Ti{sub 100-x} possess the polycrystalline structure. The main parameters of the Schottky diodes are determined in relation to the composition and structure of the metal films. As a result, it is shown that the electrical properties of Au{sub x}Ti{sub 100-x}/n-Si Schottky diodes are related to variations in the composition and structure of metal films.

  20. Schottky Diodes Based on Polyaniline/Multi-Walled Carbon Nanotube Composites

    NASA Astrophysics Data System (ADS)

    Hajibadali, A.; Nejad, M. Baghaei; Farzi, G.

    2015-08-01

    Polyaniline/multi-walled carbon nanotube composites (PANI/MWCNT), with various concentration of multi-walled carbon nanotube, were synthesized. Several Schottky diodes were fabricated, where PANI or PANI/MWCNT composites, aluminum, and gold were used as semiconductor, Schottky contact, and ohmic contact, respectively. Then current-voltage characteristics of the fabricated diodes were measured at room temperature and within the bias range of -5 to +5 V. The measurements were repeated three times for each sample to verify repeatability of experiment. The obtained results show that by increasing the MWCNT concentration, the current intensity increases. Furthermore, I-V characteristics of pure polyaniline Schottky diode follows the thermionic emission mechanism while the I-V characteristics of Schottky diodes based on PANI/MWCNT composites show two distinct power law regions. At lower voltages, the mechanism follows Ohm's Law, whereas at higher voltages, the mechanism is compatible with space charge limited conduction emission mechanism. The parameters of Schottky diodes were determined, and it was observed that critical voltage decreased when the concentration of MWCNT in the composite increased.

  1. Barrier inhomogeneities limited current and 1/f noise transport in GaN based nanoscale Schottky barrier diodes.

    PubMed

    Kumar, Ashutosh; Heilmann, M; Latzel, Michael; Kapoor, Raman; Sharma, Intu; Göbelt, M; Christiansen, Silke H; Kumar, Vikram; Singh, Rajendra

    2016-01-01

    The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN nanorods and array of nanorods is investigated. The Schottky diodes on individual nanorod show highest barrier height in comparison with large area diodes on nanorods array and epitaxial film which is in contrast with previously published work. The discrepancy between the electrical behaviour of nanoscale Schottky diodes and large area diodes is explained using cathodoluminescence measurements, surface potential analysis using Kelvin probe force microscopy and 1ow frequency noise measurements. The noise measurements on large area diodes on nanorods array and epitaxial film suggest the presence of barrier inhomogeneities at the metal/semiconductor interface which deviate the noise spectra from Lorentzian to 1/f type. These barrier inhomogeneities in large area diodes resulted in reduced barrier height whereas due to the limited role of barrier inhomogeneities in individual nanorod based Schottky diode, a higher barrier height is obtained. PMID:27282258

  2. Barrier inhomogeneities limited current and 1/f noise transport in GaN based nanoscale Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Kumar, Ashutosh; Heilmann, M.; Latzel, Michael; Kapoor, Raman; Sharma, Intu; Göbelt, M.; Christiansen, Silke H.; Kumar, Vikram; Singh, Rajendra

    2016-06-01

    The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN nanorods and array of nanorods is investigated. The Schottky diodes on individual nanorod show highest barrier height in comparison with large area diodes on nanorods array and epitaxial film which is in contrast with previously published work. The discrepancy between the electrical behaviour of nanoscale Schottky diodes and large area diodes is explained using cathodoluminescence measurements, surface potential analysis using Kelvin probe force microscopy and 1ow frequency noise measurements. The noise measurements on large area diodes on nanorods array and epitaxial film suggest the presence of barrier inhomogeneities at the metal/semiconductor interface which deviate the noise spectra from Lorentzian to 1/f type. These barrier inhomogeneities in large area diodes resulted in reduced barrier height whereas due to the limited role of barrier inhomogeneities in individual nanorod based Schottky diode, a higher barrier height is obtained.

  3. Barrier inhomogeneities limited current and 1/f noise transport in GaN based nanoscale Schottky barrier diodes

    PubMed Central

    Kumar, Ashutosh; Heilmann, M.; Latzel, Michael; Kapoor, Raman; Sharma, Intu; Göbelt, M.; Christiansen, Silke H.; Kumar, Vikram; Singh, Rajendra

    2016-01-01

    The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN nanorods and array of nanorods is investigated. The Schottky diodes on individual nanorod show highest barrier height in comparison with large area diodes on nanorods array and epitaxial film which is in contrast with previously published work. The discrepancy between the electrical behaviour of nanoscale Schottky diodes and large area diodes is explained using cathodoluminescence measurements, surface potential analysis using Kelvin probe force microscopy and 1ow frequency noise measurements. The noise measurements on large area diodes on nanorods array and epitaxial film suggest the presence of barrier inhomogeneities at the metal/semiconductor interface which deviate the noise spectra from Lorentzian to 1/f type. These barrier inhomogeneities in large area diodes resulted in reduced barrier height whereas due to the limited role of barrier inhomogeneities in individual nanorod based Schottky diode, a higher barrier height is obtained. PMID:27282258

  4. Characterization by Internal Photoemission Spectroscopy of Single-Crystal CVD Diamond Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Majdi, Saman; Gabrysch, Markus; Balmer, Richard; Twitchen, Daniel; Isberg, Jan

    2010-08-01

    Internal photoemission spectroscopy measurements have been performed to study the electrical characteristics of Schottky diodes on boron-doped single-crystalline chemical vapor deposited (SC-CVD) diamond. These measurements were compared with current-voltage ( I- V) and current-temperature ( I- T) measurements. Schottky contact barrier heights and ideality factors have been measured on Schottky contacts formed on four samples with Au, Ni, and Al contact metallizations. I- V and I- T measurements were performed in the temperature range from 300 K to 500 K. The internal photoemission method, which is less influenced by local variations in the Schottky barrier height than the other two methods, yielded the highest values of Schottky barrier heights to p-type material: ΦB = 1.78 eV to 2.10 eV, depending on the choice of contact metal and sample boron concentration.

  5. InGaAs/InP heteroepitaxial Schottky barrier diodes for terahertz applications

    NASA Technical Reports Server (NTRS)

    Bhapkar, Udayan V.; Li, Yongjun; Mattauch, Robert J.

    1992-01-01

    This paper explores the feasibility of planar, sub-harmonically pumped, anti-parallel InGaAs/InP heteroepitaxial Schottky diodes for terahertz applications. We present calculations of the (I-V) characteristics of such diodes using a numerical model that considers tunneling. We also present noise and conversion loss predictions of diode mixers operated at 500 GHz, and obtained from a multi-port mixer analysis, using the I-V characteristics predicted by our model. Our calculations indicate that InGaAs/InP heteroepitaxial Schottky barrier diodes are expected to have an I-V characteristic with an ideality factor comparable to that of GaAs Schottky diodes. However, the reverse saturation current of InGaAs/InP diodes is expected to be much greater than that of GaAs diodes. These predictions are confirmed by experiment. The mixer analyses predict that sub-harmonically pumped anti-parallel InGaAs/InP diode mixers are expected to offer a 2 dB greater conversion loss and a somewhat higher single sideband noise temperature than their GaAs counterparts. More importantly, the InGaAs/InP devices are predicted to require only one-tenth of the local oscillator power required by similar GaAs diodes.

  6. Metal silicide/Si thin-film Schottky-diode bolometers

    NASA Astrophysics Data System (ADS)

    Yuryev, Vladimir A.; Chizh, Kirill V.; Chapnin, Valery V.; Kalinushkin, Victor P.

    2015-06-01

    Recently, we have demonstrated Ni silicide/poly-Si diodes as a budget alternative to SOI-diode temperature sensors in uncooled microbolometer FPAs. This paper introduces a solution still more suitable for industry: We have developed PtSi/poly-Si Schottky diodes for microbolometers. Ease of integration of the PtSi/poly-Si diode formation process into the CMOS technology, in analogy with the internal photoemission PtSi/Si IR FPAs, is the merit of the PtSi/poly-Si sensors. Now we demonstrate PtSi/poly-Si diode microbolometers and propose them as a promising solution for focal plane arrays.

  7. On-Chip Power-Combining for High-Power Schottky Diode Based Frequency Multipliers

    NASA Technical Reports Server (NTRS)

    Siles Perez, Jose Vicente (Inventor); Chattopadhyay, Goutam (Inventor); Lee, Choonsup (Inventor); Schlecht, Erich T. (Inventor); Jung-Kubiak, Cecile D. (Inventor); Mehdi, Imran (Inventor)

    2015-01-01

    A novel MMIC on-chip power-combined frequency multiplier device and a method of fabricating the same, comprising two or more multiplying structures integrated on a single chip, wherein each of the integrated multiplying structures are electrically identical and each of the multiplying structures include one input antenna (E-probe) for receiving an input signal in the millimeter-wave, submillimeter-wave or terahertz frequency range inputted on the chip, a stripline based input matching network electrically connecting the input antennas to two or more Schottky diodes in a balanced configuration, two or more Schottky diodes that are used as nonlinear semiconductor devices to generate harmonics out of the input signal and produce the multiplied output signal, stripline based output matching networks for transmitting the output signal from the Schottky diodes to an output antenna, and an output antenna (E-probe) for transmitting the output signal off the chip into the output waveguide transmission line.

  8. Opto-electrical predistortion method using nonlinearity of schottky diode for radio-over-fiber systems

    NASA Astrophysics Data System (ADS)

    Son, Byung-Hee; Kim, Kwang-Jin; Li, Ye; Choi, Young-Wan

    2013-12-01

    In this paper, we propose a simple and efficient predistortion method using schottky diodes to compensate the nonlinearity of RoF systems. L-I curve in LD is compared with I-V curve in schottky diode and the nonlinear characteristics are analyzed. The predistortion circuit has been designed with two paths. One path is the nonlinearity generation circuit with schottky diode, while the other path has only a time delay. Then, these two paths are recombined to suppress the IMD3 (3rd inter - modulation distortion) of LD. Experimental results show that the enhancements of about 26 dBc in the IMD3 and about 8.5 dB in the SFDR are achieved at 2.4 GHz.

  9. New approach to the design of Schottky barrier diodes for THz mixers

    NASA Technical Reports Server (NTRS)

    Jelenski, A.; Grueb, A.; Krozer, V.; Hartnagel, H. L.

    1992-01-01

    Near-ideal GaAs Schottky barrier diodes especially designed for mixing applications in the THz frequency range are presented. A diode fabrication process for submicron diodes with near-ideal electrical and noise characteristics is described. This process is based on the electrolytic pulse etching of GaAs in combination with an in-situ platinum plating for the formation of the Schottky contacts. Schottky barrier diodes with a diameter of 1 micron fabricated by the process have already shown excellent results in a 650 GHz waveguide mixer at room temperature. A conversion loss of 7.5 dB and a mixer noise temperature of less than 2000 K have been obtained at an intermediate frequency of 4 GHz. The optimization of the diode structure and the technology was possible due to the development of a generalized Schottky barrier diode model which is valid also at high current densities. The common diode design and optimization is discussed on the basis of the classical theory. However, the conventional fomulas are valid only in a limited forward bias range corresponding to currents much smaller than the operating currents under submillimeter mixing conditions. The generalized new model takes into account not only the phenomena occurring at the junction such as current dependent recombination and drift/diffusion velocities, but also mobility and electron temperature variations in the undepleted epi-layer. Calculated diode I/V and noise characteristics are in excellent agreement with the measured values. Thus, the model offers the possibility of optimizing the diode structure and predicting the diode performance under mixing conditions at THz frequencies.

  10. Simplified gas sensor model based on AlGaN/GaN heterostructure Schottky diode

    SciTech Connect

    Das, Subhashis Majumdar, S.; Kumar, R.; Bag, A.; Chakraborty, A.; Biswas, D.

    2015-08-28

    Physics based modeling of AlGaN/GaN heterostructure Schottky diode gas sensor has been investigated for high sensitivity and linearity of the device. Here the surface and heterointerface properties are greatly exploited. The dependence of two dimensional electron gas (2DEG) upon the surface charges is mainly utilized. The simulation of Schottky diode has been done in Technology Computer Aided Design (TCAD) tool and I-V curves are generated, from the I-V curves 76% response has been recorded in presence of 500 ppm gas at a biasing voltage of 0.95 Volt.

  11. Simplified gas sensor model based on AlGaN/GaN heterostructure Schottky diode

    NASA Astrophysics Data System (ADS)

    Das, Subhashis; Majumdar, S.; Kumar, R.; Chakraborty, A.; Bag, A.; Biswas, D.

    2015-08-01

    Physics based modeling of AlGaN/GaN heterostructure Schottky diode gas sensor has been investigated for high sensitivity and linearity of the device. Here the surface and heterointerface properties are greatly exploited. The dependence of two dimensional electron gas (2DEG) upon the surface charges is mainly utilized. The simulation of Schottky diode has been done in Technology Computer Aided Design (TCAD) tool and I-V curves are generated, from the I-V curves 76% response has been recorded in presence of 500 ppm gas at a biasing voltage of 0.95 Volt.

  12. A 2-dimensional fully analytical model for design of high voltage junction barrier Schottky (JBS) diodes

    NASA Astrophysics Data System (ADS)

    Radhakrishnan, Rahul; Zhao, Jian H.

    2011-09-01

    A physics-based closed form analytical model for the reverse leakage current of a high voltage junction barrier Schottky (JBS) diode is developed and shown to agree with experimental results. Maximum electric field "seen" by the Schottky contact is calculated from first principles by a 2-dimensional method as a function of JBS diode design parameters and confirmed by numerical simulations. Considering thermionic emission under image force barrier lowering and quantum mechanical tunneling, electric field at the Schottky contact is then related to reverse current. In combination with previously reported forward current and resistance models, this gives a complete I- V relationship for the JBS diode. A layout of interdigitated stripes of P-N and Schottky contacts at the anode is compared theoretically with a honeycomb layout and the 2-D model is extended to the 3-D honeycomb structure. Although simulation and experimental results from 4H-Silicon Carbide (SiC) diodes are used to validate it, the model itself is applicable to all JBS diodes.

  13. Study of breakdown voltage of indium-gallium-zinc-oxide-based Schottky diode

    SciTech Connect

    Xin, Qian; Yan, Linlong; Luo, Yi; Song, Aimin

    2015-03-16

    In contrast to the intensive studies on thin-film transistors based on indium gallium zinc oxide (IGZO), the research on IGZO-based diodes is still very limited, particularly on their behavior and stability under high bias voltages. Our experiments reveal a sensitive dependence of the breakdown voltage of IGZO Schottky diodes on the anode metal and the IGZO film thickness. Devices with an Au anode are found to breakdown easily at a reverse bias as low as −2.5 V, while the devices with a Pd anode and a 200-nm, fully depleted IGZO layer have survived up to −15 V. All diodes are fabricated by radio-frequency magnetron sputtering at room temperature without any thermal treatment, yet showing an ideality factor as low as 1.14, showing the possibility of achieving high-performance Schottky diodes on flexible plastic substrate.

  14. Study of breakdown voltage of indium-gallium-zinc-oxide-based Schottky diode

    NASA Astrophysics Data System (ADS)

    Xin, Qian; Yan, Linlong; Luo, Yi; Song, Aimin

    2015-03-01

    In contrast to the intensive studies on thin-film transistors based on indium gallium zinc oxide (IGZO), the research on IGZO-based diodes is still very limited, particularly on their behavior and stability under high bias voltages. Our experiments reveal a sensitive dependence of the breakdown voltage of IGZO Schottky diodes on the anode metal and the IGZO film thickness. Devices with an Au anode are found to breakdown easily at a reverse bias as low as -2.5 V, while the devices with a Pd anode and a 200-nm, fully depleted IGZO layer have survived up to -15 V. All diodes are fabricated by radio-frequency magnetron sputtering at room temperature without any thermal treatment, yet showing an ideality factor as low as 1.14, showing the possibility of achieving high-performance Schottky diodes on flexible plastic substrate.

  15. Schottky versus bipolar 3.3 kV SiC diodes

    NASA Astrophysics Data System (ADS)

    Pérez-Tomás, A.; Brosselard, P.; Hassan, J.; Jordà, X.; Godignon, P.; Placidi, M.; Constant, A.; Millán, J.; Bergman, J. P.

    2008-12-01

    A comparative study of the electrical characteristics of 3.3 kV SiC Schottky barrier (SBD), junction bipolar Schottky (JBS) and PiN diodes is presented. 3.3 kV class 4H-SiC SBD, JBS and PiN diodes have been fabricated with an analogous technology process on similar epi wafers. Diodes have been characterized in forward, reverse and switching mode in the 25 °C-300 °C temperature range. The optimum performance of the diodes depends on the adequate use of the unipolar or bipolar advantages and is established by the final application specifications. In this respect, a reverse recovery charge versus on-resistance diagram for different current densities is also presented. DC stress tests have been performed to investigate the forward voltage drift, related to the formation of stacking faults, during the bipolar mode of operation.

  16. Numerical analysis of inhomogeneous Schottky diode with discrete barrier height patches

    NASA Astrophysics Data System (ADS)

    Kaushal, Priyanka; Chand, Subhash

    2016-06-01

    The potential profile inside the semiconductor at the metal-semiconductor contact is simulated by numerically solving the Poisson equation and the drift diffusion equations for inhomogeneous Schottky diode. From the simulated potential and the electron and hole concentrations, the drift-diffusion current as a function of bias is calculated. The simulation is carried out for various distribution patterns of barrier height patches at the metal-semiconductor contact to study the effect of barrier inhomogeneities on the Schottky diode parameters, namely barrier height and ideality factor and their temperature dependence. It is found that barrier height decreases and ideality factor increases with increase in the deviation of discrete barrier height patches in the distribution. The resulting barrier parameters are studied to understand the effect of barrier inhomogeneities on the current-voltage characteristics of inhomogeneous Schottky contact.

  17. Silicon Schottky photovoltaic diodes for solar energy conversion

    NASA Technical Reports Server (NTRS)

    Anderson, W. A.

    1975-01-01

    Various factors in Schottky barrier solar cell fabrication are evaluated in order to improve understanding of the current flow mechanism and to isolate processing variables that improve efficiency. Results of finger design, substrate resistivity, surface finishing and activation energy studies are detailed. An increased fill factor was obtained by baking of the vacuum system to remove moisture.

  18. Electrical and reliability characterization of Schottky power diodes

    NASA Astrophysics Data System (ADS)

    Gift, F. M.; Yarbrough, D.; Koslover, M.; Borst, D.; Pelly, B.

    1981-04-01

    This program examined the barrier materials which were available in late 1978. Screening, electrical characterization and step stress testing were performed on six different processes power Schottky rectifiers. The proposed drafts of MIL-S-19500 detail specifications were prepared as part of this project. The data, proposed limits and related discussions are presented in this report.

  19. Schottky Barrier mapping of the W/Si diode using ballistic electron emission microscopy

    NASA Astrophysics Data System (ADS)

    Durcan, Christopher; Balsano, Robert; Pieniazek, Nicholas; Labella, Vincent

    2015-03-01

    The Schottky barrier of the W/Si(001) diode was investigated and spatially mapped at the nanoscale using ballistic electron emission microscopy (BEEM) and ballistic hole emission microscopy (BHEM). The miscibility of tungsten and silicon creates a thin silicide upon deposition with transmission electron microscopy (TEM) and Rutherford backscattering spectrometry (RBS) showing the changes in the silicide over several weeks. Using standard current voltage measurements there is no change in the charge transport across the diode during this time period. However, BEEM measurements do show dramatic changes to the transport of ballistic electrons over time with nanoscale resolution. Time dependent Schottky barrier maps are generated over a 1 μm x 1 μm area and provide valuable insight to the barrier height homogeneity, defect formation, and interfacial effects occurring in the diode.

  20. On-Chip Power-Combining for High-Power Schottky Diode-Based Frequency Multipliers

    NASA Technical Reports Server (NTRS)

    Chattopadhyay, Goutam; Mehdi, Imran; Schlecht, Erich T.; Lee, Choonsup; Siles, Jose V.; Maestrini, Alain E.; Thomas, Bertrand; Jung, Cecile D.

    2013-01-01

    A 1.6-THz power-combined Schottky frequency tripler was designed to handle approximately 30 mW input power. The design of Schottky-based triplers at this frequency range is mainly constrained by the shrinkage of the waveguide dimensions with frequency and the minimum diode mesa sizes, which limits the maximum number of diodes that can be placed on the chip to no more than two. Hence, multiple-chip power-combined schemes become necessary to increase the power-handling capabilities of high-frequency multipliers. The design presented here overcomes difficulties by performing the power-combining directly on-chip. Four E-probes are located at a single input waveguide in order to equally pump four multiplying structures (featuring two diodes each). The produced output power is then recombined at the output using the same concept.

  1. Hydrogen sensing characteristics of semipolar (112{sup ¯}2) GaN Schottky diodes

    SciTech Connect

    Hyeon Baik, Kwang; Kim, Hyonwoong; Jang, Soohwan; Lee, Sung-Nam; Lim, Eunju; Pearton, S. J.; Ren, F.

    2014-02-17

    The hydrogen detection characteristics of semipolar (112{sup ¯}2) plane GaN Schottky diodes were investigated and compared to c-plane Ga- and N-polar and nonpolar a-plane (112{sup ¯}0) GaN diodes. The semipolar GaN diodes showed large current response to 4% hydrogen in nitrogen gas with an accompanying Schottky barrier reduction of 0.53 eV at 25 °C, and the devices exhibited full recovery to the initial current level upon switching to a nitrogen ambient. The current-voltage characteristics of the semipolar devices remained rectifying after hydrogen exposure, in sharp contrast to the case of c-plane N-polar GaN. These results show that the surface atom configuration and polarity play a strong role in hydrogen sensing with GaN.

  2. An improved forward I-V method for nonideal Schottky diodes with high series resistance

    NASA Technical Reports Server (NTRS)

    Lien, C.-D.; So, F. C. T.; Nicolet, M.-A.

    1984-01-01

    Two methods are described to obtain the value of the series resistance (R) of a Schottky diode from its forward I-V characteristic. The value of R is then used to plot the curve ln(I) versus V sub D (= V - IR) which becomes a straight line even if ln(I) versus V does not. The ideality factor n and the Schottky-barrier height of the diode then follow from the standard procedure. The main advantages of the methods are: (1) a linear regression can be used to calculate the value of R; (2) many data points are used over the whole data range, which raises the accuracy of the results, and (3) the validity of constant R assumption can be checked by the linearity of the ln (I) versus V sub D curve. The methods are illustrated on the experimental data of a real diode.

  3. Fabrication and characteristics of a 4H-SiC junction barrier Schottky diode

    NASA Astrophysics Data System (ADS)

    Fengping, Chen; Yuming, Zhang; Hongliang, Lü; Yimen, Zhang; Hui, Guo; Xin, Guo

    2011-06-01

    4H-SiC junction barrier Schottky (JBS) diodes with four kinds of design have been fabricated and characterized using two different processes in which one is fabricated by making the P-type ohmic contact of the anode independently, and the other is processed by depositing a Schottky metal multi-layer on the whole anode. The reverse performances are compared to find the influences of these factors. The results show that JBS diodes with field guard rings have a lower reverse current density and a higher breakdown voltage, and with independent P-type ohmic contact manufacturing, the reverse performance of 4H-SiC JBS diodes can be improved effectively. Furthermore, the P-type ohmic contact is studied in this work.

  4. Temperature-dependent properties of semimetal graphite-ZnO Schottky diodes

    NASA Astrophysics Data System (ADS)

    Yatskiv, R.; Grym, J.

    2012-10-01

    Highly rectifying semimetal graphite/ZnO Schottky diodes with a low-ideality-factor (1.08 at 300 K) were investigated by temperature-dependent current-voltage measurements. The current transport was dominated by thermionic emission between 300 and 420 K and the extracted barrier height followed the Schottky-Mott relation. A Richardson constant (A** = 0.272 A cm-2K-2) extracted from the Richardson plot shows nearly linear characteristics in the temperature range 300-420 K.

  5. Electronic and Interfacial Properties of PD/6H-SiC Schottky Diode Gas Sensors

    NASA Technical Reports Server (NTRS)

    Chen, Liang-Yu; Hunter, Gary W.; Neudeck, Philip G.; Bansal, Gaurav; Petit, Jeremy B.; Knight, Dak; Liu, Chung-Chiun; Wu, Qinghai

    1996-01-01

    Pd/SiC Schottky diodes detect hydrogen and hydrocarbons with high sensitivity. Variation of the diode temperature from 100 C to 200 C shows that the diode sensitivity to propylene is temperature dependent. Long-term heat treating at 425 C up to 140 hours is carried out to determine the effect of extended heat treating on the diode properties and gas sensitivity. The heat treating significantly affects the diode's capacitive characteristics, but the diode's current carrying characteristics are much more stable with a large response to hydrogen. Scanning Electron Microscopy and X-ray Spectrometry studies of the Pd surface after the heating show cluster formation and background regions with grain structure observed in both regions. The Pd and Si concentrations vary between grains. Auger Electron Spectroscopy depth profiles revealed that the heat treating promoted interdiffusion and reaction between the Pd and SiC dw broadened the interface region. This work shows that Pd/SiC Schottky diodes have significant potential as high temperature gas sensors, but stabilization of the structure is necessary to insure their repeatability in long-term, high temperature applications.

  6. Enhanced Thermionic Emission and Low 1/f Noise in Exfoliated Graphene/GaN Schottky Barrier Diode.

    PubMed

    Kumar, Ashutosh; Kashid, Ranjit; Ghosh, Arindam; Kumar, Vikram; Singh, Rajendra

    2016-03-30

    Temperature-dependent electrical transport characteristics of exfoliated graphene/GaN Schottky diodes are investigated and compared with conventional Ni/GaN Schottky diodes. The ideality factor of graphene/GaN and Ni/GaN diodes are measured to be 1.33 and 1.51, respectively, which is suggestive of comparatively higher thermionic emission current in graphene/GaN diode. The barrier height values for graphene/GaN diode obtained using thermionic emission model and Richardson plots are found to be 0.60 and 0.72 eV, respectively, which are higher than predicted barrier height ∼0.40 eV as per the Schottky-Mott model. The higher barrier height is attributed to hole doping of graphene due to graphene-Au interaction which shifts the Fermi level in graphene by ∼0.3 eV. The magnitude of flicker noise of graphene/GaN Schottky diode increases up to 175 K followed by its decrease at higher temperatures. This indicates that diffusion currents and barrier inhomogeneities dominate the electronic transport at lower and higher temperatures, respectively. The exfoliated graphene/GaN diode is found to have lower level of barrier inhomogeneities than conventional Ni/GaN diode, as well as earlier reported graphene/GaN diode fabricated using chemical vapor deposited graphene. The lesser barrier inhomogeneities in graphene/GaN diode results in lower flicker noise by 2 orders of magnitude as compared to Ni/GaN diode. Enhanced thermionic emission current, lower level of inhomogeneities, and reduced flicker noise suggests that graphene-GaN Schottky diodes may have the underlying trend for replacing metal-GaN Schottky diodes. PMID:26963627

  7. Highly Conducting Gallium-Doped ZnO Thin Film as Transparent Schottky Contact for Organic- Semiconductor-Based Schottky Diodes

    NASA Astrophysics Data System (ADS)

    Singh, Budhi; Ghosh, Subhasis

    2015-08-01

    Highly conducting and transparent Ga-doped ZnO (GZO) thin films have been grown on transparent substrates at different growth temperatures with Ga content varying from 0.01% to 10%. All films showed pronounced c-axis orientation corresponding to hexagonal wurtzite structure. The minimum resistivity of 4.3 × 10-4 Ω cm was reproducibly obtained in GZO thin film doped with 2% Ga and grown at 600°C. We have further shown that highly conducting transparent GZO thin film can be used as a Schottky contact in copper phthalocyanine (CuPc)-based Schottky diodes. The capacitance-voltage characteristics of the Al/CuPc/Au and GZO/CuPc/Au Schottky diodes show similar built-in potential ( V bi) of 0.98 V, which is close to the difference in work function between Au (5.2 eV) and Al or GZO (4.2 eV), establishing that GZO behaves as a metal electrode with work function similar to Al. Similar values of acceptor concentration (˜1015 cm-3) in CuPc were obtained from the capacitance-voltage characteristics of the Al/CuPc/Au and GZO/CuPc/Au Schottky diodes. These observations indicate the absence of interface states at the metal/organic interface in CuPc-based Schottky diodes.

  8. Schottky diode based on WS2 crossed with PEDOT/PSSA

    NASA Astrophysics Data System (ADS)

    Ortiz, Deliris; Pinto, Nicholas; Naylor, Carl; Johnson, A. T. Charlie

    An easy technique to fabricate a Schottky diode with WS2 and PEDOT-PSSA under ambient conditions is presented. WS2 is an air stable transition metal dichalcogenide semiconductor. When connected as a field effect transistor, WS2 exhibited n-type behavior with a charge mobility of ~7cm2/V-s on SiO2. PEDOT/PSSA is a conducting polymer that can be electro-spun to form fibers with a conductivity of ~1 S/cm. In this work we fabricated a Schottky diode by crossing a CVD grown monolayer WS2 crystal with a single electro-spun PEDOT/PSSA fiber. The resulting diode characteristics were analyzed assuming the standard thermionic emission model of a Schottky junction. Analysis of the results includes the ideality parameter of 4.75, diode rectification ratio ~10, and a turn on voltage of 1.4V. Efforts to investigate if these parameters are tunable with a back gate will also be presented. This work was supported by NSF-DMR-1523463 and NSF DMR RUI-1360772. ATJ acknowledges support from EFRI 2DARE EFMA-1542879.

  9. Electron Density and Capacitance at the interface of Au-ZnO Based Schottky Diode

    NASA Astrophysics Data System (ADS)

    Wu, Chin-Sheng

    ZnO with wide direct band gap (3.37 eV) is a well-known and an interesting compound semiconducting material, which have been used for the fabrication of optical, electrical, and piezoelectric devices such as light emitting diodes, solar cells. Schottky diodes are associated with quicker switching and lower turn on voltages compared to p-n junction diodes. J-V characteristics exhibit nonlinear rectifying behavior with threshold voltage of 2.1 V. The barrier heights were found to be 0.61 eV. The measured capacitance for the Schottky junction depends on the reverse bias potential and frequency. At the lower frequencies the capacitance has the higher values due to the trapping occurred at the interface through the surface roughness and lattice mismatch. We perform model potential calculation with quantum well around the interface. Model potentials allow some degree of freedom in the design of the emitted wavelength through adjustment of the energy levels. We apply the various well width w and barrier height V in order to match the device information made by Willander. Solving the Schrödinger equation with exchange- correlation energy and effective mass of electrons will produce values of the energy levels and states. The variational barrier heights result in the change of the electron density This accounts for the excessive capacitance at the interface of Schottky diode.

  10. Synthesis of n-type boron phosphide films and formation of Schottky diode: Al/n-BP/Sb

    NASA Astrophysics Data System (ADS)

    Dalui, S.; Pal, A. K.

    2008-03-01

    Phosphorous rich BP in thin film form was deposited onto fused silica substrates by co-evaporating boron (99.99%) and phosphorous (99.995%) from a tantalum boat and indirectly heated alumina crucible, respectively. Schottky diode structures for n-type BP (Al/n-BP/Sb) were fabricated out of these films. Corresponding current-voltage and capacitance-voltage characteristics of the Schottky diodes were recorded and analyzed in the light of the existing theories.

  11. Investigation of Thickness Dependence of Metal Layer in Al/Mo/4H-SiC Schottky Barrier Diodes.

    PubMed

    Lee, Seula; Lee, Jinseon; Kang, Tai-Young; Kyoung, Sinsu; Jung, Eun Sik; Kim, Kyung Hwan

    2015-11-01

    In this paper, we present the preparation and characterization of Schottky barrier diodes based on silicon carbide with various Schottky metal layer thickness values. In this structure, molybdenum and aluminum were employed as the Schottky barrier metal and top electrode, respectively. Schottky metal layers were deposited with thicknesses ranging from 1000 to 3000 Å, and top electrodes were deposited with thickness as much as 3000 Å. The deposition of both metal layers was performed using the facing target sputtering (FTS) method, and the fabricated samples were annealed with the tubular furnace at 300 degrees C under argon ambient for 10 min. The Schottky barrier height, series resistance, and ideality factor was calculated from the forward I-V characteristic curve using the methods proposed by Cheung and Cheung, and by Norde. For as-deposited Schottky diodes, we observed an increase of the threshold voltage (V(T)) as the thickness of the Schottky metal layer increased. After the annealing, the Schottky barrier heights (SBHs) of the diodes, including Schottky metal layers of over 2000 Å, increased. In the case of the Schottky metal layer deposited to 1000 Å, the barrier heights decreased due to the annealing process. This may have been caused by the interfacial penetration phenomenon through the Schottky metal layer. For variations of V(T), the SBH changed with a similar tendency. The ideality factor and series resistance showed no significant changes before or after annealing. This indicates that this annealing condition is appropriate for Mo SiC structures. Our results confirm that it is possible to control V(T) by adjusting the thickness of the Schottky metal layer. PMID:26726688

  12. Non-classical logic inverter coupling a ZnO nanowire-based Schottky barrier transistor and adjacent Schottky diode.

    PubMed

    Hosseini Shokouh, Seyed Hossein; Raza, Syed Raza Ali; Lee, Hee Sung; Im, Seongil

    2014-08-21

    On a single ZnO nanowire (NW), we fabricated an inverter-type device comprising a Schottky diode (SD) and field-effect transistor (FET), aiming at 1-dimensional (1D) electronic circuits with low power consumption. The SD and adjacent FET worked respectively as the load and driver, so that voltage signals could be easily extracted as the output. In addition, NW FET with a transparent conducting oxide as top gate turned out to be very photosensitive, although ZnO NW SD was blind to visible light. Based on this, we could achieve an array of photo-inverter cells on one NW. Our non-classical inverter is regarded as quite practical for both logic and photo-sensing due to its performance as well as simple device configuration. PMID:24985947

  13. Characterization of electrical explosion of Schottky diode for one-shot switch applications

    NASA Astrophysics Data System (ADS)

    Hu, Bo; Jiao, Jianshe; Zhu, Peng; Wu, Lizhi; Ye, Yinghua; Shen, Ruiqi

    2014-12-01

    The electrical explosion characteristics of Schottky diode for one-shot switch applications were acquired by analysis of photographs of high speed camera and current-voltage histories. Four types of connections among Schottky diode, top electrode and discharge capacitor were studied. Results show that type B has the longest time (1.4 ms) of optical radiation and highest energy consumption, which makes it easier to turn on the switch. The charge flux of plasma was determined to be 24.5 Q/(s m2) by parallel electrode plates method. Atomic emission spectroscopic measurements were devoted to determine plasma temperature and density during electrical explosion. Results show that temperature is between 4000 K and 5000 K, and density is about 1024 m-3. The one-shot switch based on ceramics has been fabricated and characterized and the results show that the peak current and the rise time are about 963.77 A and 381.6 ns, respectively.

  14. Electrical Properties of Recessed Algan/Gan Schottky Diodes Under off-State Stress

    NASA Astrophysics Data System (ADS)

    Florovič, Martin; Kováč, Jaroslav; Benko, Peter; Chvála, Aleš; Škriniarová, Jaroslava; Kordó, Peter

    2014-09-01

    Electrical properties of recessed and non-recessed AlGaN/GaN Schottky diodes under off-state stress were investigated. The samples were consecutively stressed by the stepped negative bias (-60 V). Before and after the stress I-V and C-V characteristics were evaluated to verify the device degradation process. Finally, the degradation mechanism and the influence of AlGaN recessed layer thickness on the electrical properties of the Schottky diodes were analysed. It was found that the short time stress influence on I-V characteristics was most negligible for the non-recessed sample. Shallow and deep recessed samples exhibited initial trap filling and reverse current decrease. Generally it was found that the stress voltage near 60 V caused recoverable device degradation

  15. Charge transport mechanisms in Schottky diodes based on low-resistance CdTe:Mn

    SciTech Connect

    Kosyachenko, L. A. Yurtsenyuk, N. S.; Rarenko, I. M.; Sklyarchuk, V. M.; Sklyarchuk, O. F.; Zakharuk, Z. I.; Grushko, E. V.

    2013-07-15

    CdTe:Mn crystals with a resistivity of {approx}1 {Omega} cm at 300 K and Schottky diodes based on them are investigated. The electrical conductivity of the material and its temperature variations are explained in terms of the statistics of electrons and holes in semiconductors with allowance for the compensation processes. The ionization energy and the degree of compensation of the donors responsible for the conductivity are determined. It is shown that, in the case of forward connection and low reverse biases, the currents in Au/CdTe:Mn Schottky diode are determined by generation-recombination processes in the space-charge region. At higher reverse biases (above 1.5-2 V) the excess current is caused by electron tunneling from the metal to the semiconductor, and at even higher voltages (>6-7 V) an additional increase in the reverse current due to avalanche processes is observed.

  16. Study of 1/f noise characteristics in Cu/n-GaN Schottky barrier diode

    NASA Astrophysics Data System (ADS)

    Garg, Manjari; Kumar, Ashutosh; Nagarajan, S.; Sopanen, M.; Singh, R.

    2016-05-01

    The 1/f noise characteristics of Cu/n-GaN Schottky barrier diode in the forward bias region have been studied. Temperature dependent 1/f noise measurements were performed over a wide range of temperature from 100 to 320K and frequency range of 1 to 100 Hz. The noise spectra exhibited frequency dependence proportional with 1/fγ implying that flicker noise is dominant. Current dependence of noise was analyzed in order to fix the diode current such that the noise may be determined by the Schottky barrier alone without the contribution from the series resistance. It was observed that the spectral power density of current noise SI was nearly independent of temperature. This behavior has been attributed to the modulation of the charge density by multi step tunneling process within the space charge region of the semiconductor.

  17. Device Design of Diamond Schottky-pn Diode for Low-Loss Power Electronics

    NASA Astrophysics Data System (ADS)

    Makino, Toshiharu; Kato, Hiromitsu; Takeuchi, Daisuke; Ogura, Masahiko; Okushi, Hideyo; Yamasaki, Satoshi

    2012-09-01

    The device parameters of a novel diamond diode, namely, a Schottky-pn diode (SPND), are analyzed to realize a fast switching time, a low on-resistance, and a high blocking voltage simultaneously. The SPND is composed of an n-type active layer sandwiched between a highly doped p+-type layer and a Schottky metal. The key structure is the fully depleted n-type layer. From the simulations of the energy band diagram based on the key structure of the SPND using Poisson's equations, it is concluded that the low donor density in the n-type layer and the high acceptor density in the p+-type layer are key points for the high-performance SPND.

  18. An integrated membrane sub-harmonic Schottky diode mixers at 340GHz

    NASA Astrophysics Data System (ADS)

    Wang, Junlong; Yang, Dabao; Xing, Dong; Liang, Shixiong; Zhang, Lisen; Zhao, Xiangyang; Feng, Zhihong

    2015-11-01

    This paper presents a sub-harmonic mixer operating over the spectral band 332-348 GHz. The mixers employ integrated GaAs membrane Schottky diode technology. The simulated results show that the conversion loss of the mixer is below dB in the band from 333 GHz to 347 GHz with a local oscillator power requirement of 5mW.The minimum is 8.2dB at 344GHz.

  19. Development of Short Electrical Pulses in a Schottky Line Periodically Loaded with Resonant Tunneling Diodes

    NASA Astrophysics Data System (ADS)

    Essimbi, B. Z.; Jäger, D.

    2012-06-01

    The characteristics of a Schottky line periodically loaded with resonant tunneling diodes (RTDs) are discussed for the development of short electrical pulses. RTDs act as electronic switches and exhibit a pronounced N-shaped I-V characteristic even at millimetre wave frequencies. The dynamics of the line is reduced to an extended KdV equation. These dynamics are considered both within the method of perturbation and the numerical integration of the transmission equation of the line.

  20. Observation of negative differential capacitance (NDC) in Ti Schottky diodes on SiGe islands

    SciTech Connect

    Rangel-Kuoppa, Victor-Tapio; Jantsch, Wolfgang; Tonkikh, Alexander; Zakharov, Nikolay; Werner, Peter

    2013-12-04

    The Negative Differential Capacitance (NDC) effect on Ti Schottky diodes formed on n-type Silicon samples with embedded Germanium Quantum Dots (QDs) is observed and reported. The NDC-effect is detected using capacitance-voltage (CV) method at temperatures below 200 K. It is explained by the capture of electrons in Germanium QDs. Our measurements reveal that each Ge QD captures in average eight electrons.

  1. Fabrication and optimization of a whiskerless Schottky barrier diode for submillimeter wave applications

    NASA Technical Reports Server (NTRS)

    Bishop, W.; Mattauch, R. J.

    1990-01-01

    The following accomplishments were made towards the goal of an optimized whiskerless diode chip for submillimeter wavelength applications. (1) Surface channel whiskerless diode structure was developed which offers excellent DC and RF characteristics, reduced shunt capacitance and simplified fabrication compared to mesa and proton isolated structures. (2) Reliable fabrication technology was developed for the surface channel structure. The new anode plating technology is a major improvement. (3) DC and RF characterization of the surface channel diode was compared with whisker contacted diodes. This data indicates electrical performance as good as the best reported for similar whisker contacted devices. (4) Additional batches of surface channel diodes were fabricated with excellent I-V and reduced shunt capacitance. (5) Large scale capacitance modelinng was done for the planar diode structure. This work revealed the importance of removing the substrate gallium arsenide for absolute minimum pad capacitance. (6) A surface channel diode was developed on quartz substrate and this substrate was completely removed after diode mounting for minimum parasitic capacitance. This work continues with the goal of producing excellent quality submillimeter wavelength planar diodes which satisfy the requirements of easy handling and robustness. These devices will allow the routine implementation of Schottky receivers into space-based applications at frequencies as high as 1 THz, and, in the future, beyond.

  2. A 55-kW Three-Phase Inverter with Si IGBTs and SiC Schottky Diodes

    SciTech Connect

    Tolbert, Leon M; Ozpineci, Burak; Chinthavali, Madhu Sudhan; Mantooth, Homer A; Kashyap, Avinash S

    2009-01-01

    Silicon carbide (SiC) power devices are expected to have an impact on power converter efficiency, weight, volume, and reliability. Currently, only SiC Schottky diodes are commercially available at relatively low current ratings. Oak Ridge National Laboratory has collaborated with Cree and Semikron to build a Si insulated-gate bipolar transistor-SiC Schottky diode hybrid 55-kW inverter by replacing the Si p-n diodes in Semikron's automotive inverter with Cree's made-to-order higher current SiC Schottky diodes. This paper presents the developed models of these diodes for circuit simulators, shows inverter test results, and compares the results with those of a similar all-Si inverter.

  3. Design Considerations for Heavily-Doped Cryogenic Schottky Diode Varactor Multipliers

    NASA Technical Reports Server (NTRS)

    Schlecht, E.; Maiwald, F.; Chattopadhyay, G.; Martin, S.; Mehdi, I.

    2001-01-01

    Diode modeling for Schottky varactor frequency multipliers above 500 GHz is presented with special emphasis placed on simple models and fitted equations for rapid circuit design. Temperature- and doping-dependent mobility, resistivity, and avalanche current multiplication and breakdown are presented. Next is a discussion of static junction current, including the effects of tunneling as well as thermionic emission. These results have been compared to detailed measurements made down to 80 K on diodes fabricated at JPL, followed by a discussion of the effect on multiplier efficiency. Finally, a simple model of current saturation in the undepleted active layer suitable for inclusion in harmonic balance simulators is derived.

  4. X-ray detectors based on GaN Schottky diodes

    SciTech Connect

    Duboz, Jean-Yves; Frayssinet, Eric; Chenot, Sebastien; Reverchon, Jean-Luc; Idir, Mourad

    2010-10-18

    GaN Schottky diodes have been fabricated and tested as x-ray detectors in the range from 6 to 21 keV. The spectral response has been measured and is compared to its theoretical value. The study of the response and its temporal dynamics as a function of the bias allows to identify a photovoltaic behavior at low bias and a photoconductive one at larger reverse biases. The GaN diode turned out to be linear as a function of the incident power. The noise and detectivity are given and discussed.

  5. 670 GHz Schottky Diode Based Subharmonic Mixer with CPW Circuits and 70 GHz IF

    NASA Technical Reports Server (NTRS)

    Chattopadhyay, Goutam (Inventor); Schlecht, Erich T. (Inventor); Lee, Choonsup (Inventor); Lin, Robert H. (Inventor); Gill, John J. (Inventor); Sin, Seth (Inventor); Mehdi, Imran (Inventor)

    2014-01-01

    A coplanar waveguide (CPW) based subharmonic mixer working at 670 GHz using GaAs Schottky diodes. One example of the mixer has a LO input, an RF input and an IF output. Another possible mixer has a LO input, and IF input and an RF output. Each input or output is connected to a coplanar waveguide with a matching network. A pair of antiparallel diodes provides a signal at twice the LO frequency, which is then mixed with a second signal to provide signals having sum and difference frequencies. The output signal of interest is received after passing through a bandpass filter tuned to the frequency range of interest.

  6. Optical properties of ITO/ZnO Schottky diode with enhanced UV Photoresponse

    NASA Astrophysics Data System (ADS)

    Lee, Hsin-Yen; Chern, Ming-Yau

    2015-11-01

    Photoluminescence (PL) spectra of zinc oxide (ZnO) samples with different hydrogen peroxide (H2O2) treatment durations were measured to examine several point defects on the surfaces of the films. The results suggest successful oxidation through the reaction between oxygen radicals dissociated from H2O2 and the ZnO surface. To further confirm the defect-induced gain mechanism, we fabricated highly transparent indium-tin-oxide (ITO)/ZnO Schottky diodes and measured the key diode characteristics. Photocurrents were measured at different wavelengths, and possible explanations for the high optical gain within the ultraviolet (UV) region are provided.

  7. Temperature-dependent characteristics of 4H—SiC junction barrier Schottky diodes

    NASA Astrophysics Data System (ADS)

    Chen, Feng-Ping; Zhang, Yu-Ming; Zhang, Yi-Men; Tang, Xiao-Yan; Wang, Yue-Hu; Chen, Wen-Hao

    2012-03-01

    The current—voltage characteristics of 4H—SiC junction barrier Schottky (JBS) diodes terminated by an offset field plate have been measured in the temperature range of 25-300 °C. An experimental barrier height value of about 0.5 eV is obtained for the Ti/4H—SiC JBS diodes at room temperature. A decrease in the experimental barrier height and an increase in the ideality factor with decreasing temperature are shown. Reverse recovery testing also shows the temperature dependence of the peak recovery current density and the reverse recovery time. Finally, a discussion of reducing the reverse recovery time is presented.

  8. 670-GHz Schottky Diode-Based Subharmonic Mixer with CPW Circuits and 70-GHz IF

    NASA Technical Reports Server (NTRS)

    Chattopadhyay, Goutam; Schlecht, Erich T.; Lee, Choonsup; Lin, Robert H.; Gill, John J.; Mehdi, Imran; Sin, Seth; Deal, William; Loi, Kwok K.; Nam, Peta; Rodriguez, Bryan

    2012-01-01

    GaAs-based, sub-harmonically pumped Schottky diode mixers offer a number of advantages for array implementation in a heterodyne receiver system. Since the radio frequency (RF) and local oscillator (LO) signals are far apart, system design becomes much simpler. A proprietary planar GaAs Schottky diode process was developed that results in very low parasitic anodes that have cutoff frequencies in the tens of terahertz. This technology enables robust implementation of monolithic mixer and frequency multiplier circuits well into the terahertz frequency range. Using optical and e-beam lithography, and conventional epitaxial layer design with innovative usage of GaAs membranes and metal beam leads, high-performance terahertz circuits can be designed with high fidelity. All of these mixers use metal waveguide structures for housing. Metal machined structures for RF and LO coupling hamper these mixers to be integrated in multi-pixel heterodyne array receivers for spectroscopic and imaging applications. Moreover, the recent developments of terahertz transistors on InP substrate provide an opportunity, for the first time, to have integrated amplifiers followed by Schottky diode mixers in a heterodyne receiver at these frequencies. Since the amplifiers are developed on a planar architecture to facilitate multi-pixel array implementation, it is quite important to find alternative architecture to waveguide-based mixers.

  9. Fabrication and electrical characterization of nickel/p-Si Schottky diode at low temperature

    NASA Astrophysics Data System (ADS)

    Kumar, Rajender; Chand, Subhash

    2016-08-01

    In this study the current-voltage and capacitance-voltage characteristics of metal semiconductor Ni/p-Si(100) based Schottky diode on p- type silicon measured over a wide temperature range (60-300 K) have been studied on the basis of thermionic emission diffusion mechanism and the assumption of a Gaussian distribution of barrier heights. The parameters ideality factor, barrier height and series resistance are determined from the forward bias current-voltage characteristics. The barrier height for Ni/p-Si(100) Schottky diode found to vary between 0.513 eV and 0.205 eV, and the ideality factor between 2.34 and 8.88 on decreasing temperature 300-60 K. A plot involving the use of ϕb versus 1/T data is used to gather evidence for the occurrence of a Gaussian distribution of barrier height and obtain the value of standard deviation. The observed temperature dependences of barrier height and ideality factor and non-linear activation energy plot are attributed to the Gaussian distribution of barrier heights at the metal-semiconductor contact. The barrier height of Ni/p-Si(100) Schottky diode was also measured over wide temperature from the capacitance-voltage study.

  10. X-ray detection with zinc-blende (cubic) GaN Schottky diodes

    PubMed Central

    Gohil, T.; Whale, J.; Lioliou, G.; Novikov, S. V.; Foxon, C. T.; Kent, A. J.; Barnett, A. M.

    2016-01-01

    The room temperature X-ray responses as functions of time of two n type cubic GaN Schottky diodes (200 μm and 400 μm diameters) are reported. The current densities as functions of time for both diodes showed fast turn-on transients and increases in current density when illuminated with X-ray photons of energy up to 35 keV. The diodes were also electrically characterized: capacitance, implied depletion width and dark current measurements as functions of applied bias at room temperature are presented. At −5 V reverse bias, the capacitances of the diodes were measured to be (84.05 ± 0.01) pF and (121.67 ± 0.02) pF, respectively. At −5 V reverse bias, the dark current densities of the diodes were measured to be (347.2 ± 0.4) mA cm−2 and (189.0 ± 0.2) mA cm−2, respectively. The Schottky barrier heights of the devices (0.52 ± 0.07) eV and (0.63 ± 0.09) eV, respectively, were extracted from the forward dark current characteristics. PMID:27403806

  11. X-ray detection with zinc-blende (cubic) GaN Schottky diodes

    NASA Astrophysics Data System (ADS)

    Gohil, T.; Whale, J.; Lioliou, G.; Novikov, S. V.; Foxon, C. T.; Kent, A. J.; Barnett, A. M.

    2016-07-01

    The room temperature X-ray responses as functions of time of two n type cubic GaN Schottky diodes (200 μm and 400 μm diameters) are reported. The current densities as functions of time for both diodes showed fast turn-on transients and increases in current density when illuminated with X-ray photons of energy up to 35 keV. The diodes were also electrically characterized: capacitance, implied depletion width and dark current measurements as functions of applied bias at room temperature are presented. At ‑5 V reverse bias, the capacitances of the diodes were measured to be (84.05 ± 0.01) pF and (121.67 ± 0.02) pF, respectively. At ‑5 V reverse bias, the dark current densities of the diodes were measured to be (347.2 ± 0.4) mA cm‑2 and (189.0 ± 0.2) mA cm‑2, respectively. The Schottky barrier heights of the devices (0.52 ± 0.07) eV and (0.63 ± 0.09) eV, respectively, were extracted from the forward dark current characteristics.

  12. X-ray detection with zinc-blende (cubic) GaN Schottky diodes.

    PubMed

    Gohil, T; Whale, J; Lioliou, G; Novikov, S V; Foxon, C T; Kent, A J; Barnett, A M

    2016-01-01

    The room temperature X-ray responses as functions of time of two n type cubic GaN Schottky diodes (200 μm and 400 μm diameters) are reported. The current densities as functions of time for both diodes showed fast turn-on transients and increases in current density when illuminated with X-ray photons of energy up to 35 keV. The diodes were also electrically characterized: capacitance, implied depletion width and dark current measurements as functions of applied bias at room temperature are presented. At -5 V reverse bias, the capacitances of the diodes were measured to be (84.05 ± 0.01) pF and (121.67 ± 0.02) pF, respectively. At -5 V reverse bias, the dark current densities of the diodes were measured to be (347.2 ± 0.4) mA cm(-2) and (189.0 ± 0.2) mA cm(-2), respectively. The Schottky barrier heights of the devices (0.52 ± 0.07) eV and (0.63 ± 0.09) eV, respectively, were extracted from the forward dark current characteristics. PMID:27403806

  13. The effects of nuclear radiation on Schottky power diodes and power MOSFETs

    NASA Astrophysics Data System (ADS)

    Kulisek, Jonathan Andrew

    NASA is exploring the potential use of nuclear reactors as power sources for future space missions. These missions will require electrical components, consisting of power circuits and semiconductor devices, to be placed in close vicinity to the reactor, in the midst of a high neutron and gamma-ray radiation field. Therefore, the primary goal of this research is to examine the effects of a mixed neutron and gamma-ray radiation field on the static and dynamic electrical performance of power Schottky diodes and power MOSFETs in order to support future design efforts of radiation-hard power semiconductors and circuits. In order to accomplish this, non-radiation hardened commercial power Si and SiC Schottky power diodes, manufactured by International Rectifier and Cree, respectively, were irradiated in the Ohio State University Research Reactor (OSURR), and their degradation in electrical performance was observed using I-V characterization. Key electrical performance parameters were extracted using least squares curve-fits of the corresponding semiconductor physics model equations to the experimental data, and these electrical performance parameters were used to model the diodes in PSpice. A half-wave rectifier circuit containing Cree SiC Schottky diodes, rated for 5 A DC forward current and 1200 V DC blocking voltage, was also tested and modeled in order to determine and analyze changes in overall circuit performance and diode power dissipation as a function of radiation dose. Also, electrical components will be exposed to charged particle radiation from space, such as high energy protons in the Van Allen Radiation Belts surrounding earth. Therefore, the results from this study, with respect to the Si and SiC Schottky power diodes, were compared to results published by NASA, which had tested the same diode models at the Indiana University Cyclotron Facility (IUCF) with a 203 MeV proton beam. The comparison was made on the basis of displacement damage dose, calculated

  14. Electronic Properties of DNA-Based Schottky Barrier Diodes in Response to Alpha Particles.

    PubMed

    Al-Ta'ii, Hassan Maktuff Jaber; Periasamy, Vengadesh; Amin, Yusoff Mohd

    2015-01-01

    Detection of nuclear radiation such as alpha particles has become an important field of research in recent history due to nuclear threats and accidents. In this context; deoxyribonucleic acid (DNA) acting as an organic semiconducting material could be utilized in a metal/semiconductor Schottky junction for detecting alpha particles. In this work we demonstrate for the first time the effect of alpha irradiation on an Al/DNA/p-Si/Al Schottky diode by investigating its current-voltage characteristics. The diodes were exposed for different periods (0-20 min) of irradiation. Various diode parameters such as ideality factor, barrier height, series resistance, Richardson constant and saturation current were then determined using conventional, Cheung and Cheung's and Norde methods. Generally, ideality factor or n values were observed to be greater than unity, which indicates the influence of some other current transport mechanism besides thermionic processes. Results indicated ideality factor variation between 9.97 and 9.57 for irradiation times between the ranges 0 to 20 min. Increase in the series resistance with increase in irradiation time was also observed when calculated using conventional and Cheung and Cheung's methods. These responses demonstrate that changes in the electrical characteristics of the metal-semiconductor-metal diode could be further utilized as sensing elements to detect alpha particles. PMID:26007733

  15. Electronic Properties of DNA-Based Schottky Barrier Diodes in Response to Alpha Particles

    PubMed Central

    Al-Ta’ii, Hassan Maktuff Jaber; Periasamy, Vengadesh; Amin, Yusoff Mohd

    2015-01-01

    Detection of nuclear radiation such as alpha particles has become an important field of research in recent history due to nuclear threats and accidents. In this context; deoxyribonucleic acid (DNA) acting as an organic semiconducting material could be utilized in a metal/semiconductor Schottky junction for detecting alpha particles. In this work we demonstrate for the first time the effect of alpha irradiation on an Al/DNA/p-Si/Al Schottky diode by investigating its current-voltage characteristics. The diodes were exposed for different periods (0–20 min) of irradiation. Various diode parameters such as ideality factor, barrier height, series resistance, Richardson constant and saturation current were then determined using conventional, Cheung and Cheung’s and Norde methods. Generally, ideality factor or n values were observed to be greater than unity, which indicates the influence of some other current transport mechanism besides thermionic processes. Results indicated ideality factor variation between 9.97 and 9.57 for irradiation times between the ranges 0 to 20 min. Increase in the series resistance with increase in irradiation time was also observed when calculated using conventional and Cheung and Cheung’s methods. These responses demonstrate that changes in the electrical characteristics of the metal-semiconductor-metal diode could be further utilized as sensing elements to detect alpha particles. PMID:26007733

  16. Edge termination study and fabrication of a 4H-SiC junction barrier Schottky diode

    NASA Astrophysics Data System (ADS)

    Chen, Feng-Ping; Zhang, Yu-Ming; Zhang, Yi-Men; Tang, Xiao-Yan; Wang, Yue-Hu; Chen, Wen-Hao

    2011-11-01

    The 4H-SiC junction barrier Schottky (JBS) diodes terminated by field guard rings and offset field plate are designed, fabricated and characterized. It is shown experimentally that a 3-μ P-type implantation window spacing gives an optimum trade-off between forward drop voltage and leakage current density for these diodes, yielding a specific on-resistance of 8.3 mΩ·cm2. A JBS diode with a turn-on voltage of 0.65 V and a reverse current density less than 1 A/cm2 under 500 V is fabricated, and the reverse recovery time is tested to be 80 ns, and the peak reverse current is 28.1 mA. Temperature-dependent characteristics are also studied in a temperature range of 75 °C-200 °C. The diode shows a stable Schottky barrier height of up to 200 °C and a stable operation under a continuous forward current of 100 A/cm2.

  17. Barrier height inhomogeneity and its impact on (Al,In,Ga)N Schottky diodes

    NASA Astrophysics Data System (ADS)

    Laurent, Matthew A.; Gupta, Geetak; Suntrup, Donald J.; DenBaars, Steven P.; Mishra, Umesh K.

    2016-02-01

    III-N materials, especially ternary and quaternary alloys, are profoundly affected by barrier height inhomogeneity as evidenced by great variability in reported barrier height and Richardson constant values for Schottky diode samples involving epilayers with identical material composition. Research into AlInGaN-based devices is gaining traction due to its usefulness for strain engineering, polarization engineering, and vertical device design. Thus it is important to characterize the Schottky barrier height between AlInGaN and technologically relevant metals like nickel. It is proposed that alloy composition fluctuations inherent to low-temperature III-N alloys result in a Schottky barrier height inhomogeneity, and that the Schottky barrier height follows a Gaussian distribution. Current vs voltage data as a function of temperature was measured for three AlInGaN samples of varying composition. Utilizing a model tailored to thermionic emission over a Gaussian distribution of barriers, both the average barrier height and the standard deviation in the distribution were extracted from experimental data via multiple linear regression. Average barrier height was found to correlate with the AlInGaN band gap, while the standard deviation in barrier height increased with aluminum and indium concentration on the group-III sublattice.

  18. Studies on the Thermal Stability of Ni/n–GaN and Pt/n–GaN Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Kumar, Ashish; Mahajan, Somna; Vinayak, Seema; Singh, R.

    2016-08-01

    High temperature annealing of Ni and Pt Schottky diodes on n-GaN has been investigated. Ni/n–GaN and Pt/n–GaN Schottky diodes were fabricated using ultra high vacuum and annealed at various temperatures (200 °C‑700 °C) using rapid thermal anneal system. It was observed that in case of Ni/GaN diodes, the Schottky barrier height increases for 200 °C and then decreases with increase in annealing temperature. For Pt/GaN diodes, the barrier height found to decrease with increase in annealing temperature. The observed variation of barrier height and ideality factor is discussed on the basis of interfacial chemical reactions between metal and semiconductor.

  19. Oxidation induced internal exoemission in thin film Mg/Si Schottky diodes

    NASA Astrophysics Data System (ADS)

    Nienhaus, Hermann

    2005-03-01

    When thin film Mg/p-Si(111) diodes are exposed to oxygen molecules an internal reverse current is observed. Such chemicurrents are due to electron-hole pairs created by the chemical reaction at the metal surface and indicate the non-adiabatic character of chemical energy dissipation. The transient of the current represents the kinetics of the Mg oxidation process and may be explained by a nucleation-and-growth model. Two types of Mg/Si diodes with different homogeneous Schottky barrier heights of 0.7 and 0.8 eV, respectively, could be fabricated by modifying the Mg/Si interface. A dependence between the homogeneous barrier height and the sensitivity of the diode to detect the chemically induced hot charge carriers can be demonstrated. The energy distribution of the internally excited charge carriers deduced from the data may be described by a Boltzmann exponential function with an effective electron temperature of approximately 1600 K.

  20. Schottky barrier diode embedded AlGaN/GaN switching transistor

    NASA Astrophysics Data System (ADS)

    Park, Bong-Ryeol; Lee, Jung-Yeon; Lee, Jae-Gil; Lee, Dong-Myung; Kim, Moon-Kyung; Cha, Ho-Young

    2013-12-01

    We developed a Schottky barrier diode (SBD) embedded AlGaN/GaN switching transistor to allow negative current flow during off-state condition. An SBD was embedded in a recessed normally-off AlGaN/GaN-on-Si metal-oxide-semiconductor heterostructure field-effect transistor (MOSHFET). The fabricated device exhibited normally-off characteristics with a gate threshold voltage of 2.8 V, a diode turn-on voltage of 1.2 V, and a breakdown voltage of 849 V for the anode-to-drain distance of 8 µm. An on-resistance of 2.66 mΩcm2 was achieved at a gate voltage of 16 V in the forward transistor mode. Eliminating the need for an external diode, the SBD embedded switching transistor has advantages of significant reduction in parasitic inductance and chip area.

  1. Low-frequency noise properties in Pt-indium gallium zinc oxide Schottky diodes

    SciTech Connect

    Zhang, Jiawei; Zhang, Linqing; Ma, Xiaochen; Wilson, Joshua; Jin, Jidong; Du, Lulu; Xin, Qian; Song, Aimin

    2015-08-31

    The low-frequency noise properties of Pt-indium gallium zinc oxide (IGZO) Schottky diodes at different forward biases are investigated. The IGZO layer and Pt contact were deposited by RF sputtering at room temperature. The diode showed an ideality factor of 1.2 and a barrier height of 0.94 eV. The current noise spectral density exhibited 1/f behavior at low frequencies. The analysis of the current dependency of the noise spectral density revealed that for the as-deposited diode, the noise followed Luo's mobility and diffusivity fluctuation model in the thermionic-emission-limited region and Hooge's empirical theory in the series-resistance-limited region. A low Hooge's constant of 1.4 × 10{sup −9} was found in the space-charge region. In the series-resistance-limited region, the Hooge's constant was 2.2 × 10{sup −5}. After annealing, the diode showed degradation in the electrical performance. The interface-trap-induced noise dominated the noise spectrum. By using the random walk model, the interface-trap density was obtained to be 3.6 × 10{sup 15 }eV{sup −1 }cm{sup −2}. This work provides a quantitative approach to analyze the properties of Pt-IGZO interfacial layers. These low noise properties are a prerequisite to the use of IGZO Schottky diodes in switch elements in memory devices, photosensors, and mixer diodes.

  2. Characteristics of SiC pillar-shaped nanostructure Schottky diode

    NASA Astrophysics Data System (ADS)

    Han, Sang Youn; Lee, Jong-Lam

    2009-07-01

    The effect of geometrical shape on the electrical transport was analyzed in SiC nanostructure Schottky diode. Two different contacts, the pillar-shaped nanostructure contact and nanoscale contact, were fabricated separately from top down method. Compared with nanoscale contact, the nanostructure contact showed the low current level, but similar Schottky barrier property. This is attributed by the fact that pillar-shaped nanostructure has smaller base areas which prevent the electrons from efficient transport into the nanostructure. This led to the decrease in electron mobility, resulting in the higher resistance in the I-V curves. From Fowler-Nordheim plot, it was almost linear for higher voltage region, but the linear behavior disappeared in the lower one. This implied that the electron tunneling was the main transport mechanism at higher electric field in this structure.

  3. Mechanism of dislocation-governed charge transport in schottky diodes based on gallium nitride

    SciTech Connect

    Belyaev, A. E.; Boltovets, N. S.; Ivanov, V. N.; Klad'ko, V. P.; Konakova, R. V. Kudrik, Ya. Ya.; Kuchuk, A. V.; Milenin, V. V.; Sveshnikov, Yu. N.; Sheremet, V. N.

    2008-06-15

    A mechanism of charge transport in Au-TiB{sub x}-n-GaN Schottky diodes with a space charge region considerably exceeding the de Broglie wavelength in GaN is studied. Analysis of temperature dependences of current-voltage (I-V) characteristics of forward-biased Schottky barriers showed that, in the temperature range 80-380 K, the charge transport is performed by tunneling along dislocations intersecting the space charge region. Estimation of dislocation density {rho} by the I-V characteristics, in accordance with a model of tunneling along the dislocation line, gives the value {rho} {approx} 1.7 x 10{sup 7} cm{sup -2}, which is close in magnitude to the dislocation density measured by X-ray diffractometry.

  4. New type of Schottky diode-based Cu-Al-Mn-Cr shape memory material films

    NASA Astrophysics Data System (ADS)

    Aksu Canbay, C.; Dere, A.; Mensah-Darkwa, Kwadwo; Al-Ghamdi, Ahmed; Karagoz Genç, Z.; Gupta, R. K.; Yakuphanoglu, F.

    2016-07-01

    Cr-doped CuAlMn shape memory alloys were produced by arc melting method. The effects of Cr content on microstructure and transformation parameters of were investigated. The alloys were characterized by X-ray analysis, optical microscope observations and differential scanning calorimetry measurements. The grain size of the alloys was decreased by the addition of Cr into CuAlMn alloy system. The martensite transformation temperature was shifted both the lower temperature and higher temperature with the addition of chromium. This change was explained on the basis of the change in the thermodynamics such as enthalpy, entropy and activation energy values. The obtained results indicate that the phase transformation temperatures of the CuAlMn alloy system can be controlled by addition of Cr. We fabricated a Schottky barrier diode and observed that ideality factor and barrier height increase with increasing temperature. The diodes exhibited a thermal sensor behavior. This indicates that Schottky diode-based Cu-Al-Mn-Cr shape memory material films can be used as a sensor in high-temperature measurement applications.

  5. THz frequency multiplier chains base on planar Schottky diodes

    NASA Technical Reports Server (NTRS)

    Maiwald, F.; Schlecht, E.; Maestrini, A.; Chattopadhyay, G.; Pearson, J.; Pukala, D.; Mehdi, I.

    2002-01-01

    The Herschel Space Observatory (HSO), an ESA cornerstone mission with NASA contribution, will enable a comprehensive study of the galactic as well as the extra galactic universe. At the heart of this exploration are ultra sensitive coherent detectors that can allow for high-resolution spectroscopy. Successful operation of these receivers is predicated on providing a sufficiently powerful local oscillator (LO) source. Historically, a versatile space qualified LO source for frequencies beyond 500 GHz has been difficult if not impossible. This paper will focus on the effort under way to develop, build, characterize and qualify a LO chain to 1200 GHz (Band 5 on HSO) that is based on planar GaAs diodes mounted in waveguide circuits. State-of-the-art performance has been obtained from a three-stage ( x2 x 2 x 3 ) multiplier chain that can provide a peak output power of 120 uW (1178 GHz) at room temperature and a peak output power of 190 uW at 1183 GHz when cooled to 113 K. Implementation of this LO source for the Heterodyne Instrument for Far Infrared (HIFI) on HSO will be discussed in detail.

  6. Simulations about self-absorption of tritium in titanium tritide and the energy deposition in a silicon Schottky barrier diode.

    PubMed

    Li, Hao; Liu, Yebing; Hu, Rui; Yang, Yuqing; Wang, Guanquan; Zhong, Zhengkun; Luo, Shunzhong

    2012-11-01

    Simulations on the self-absorption of tritium electrons in titanium tritide films and the energy deposition in a silicon Schottky barrier diode are carried out using the Geant4 radiation transport toolkit. Energy consumed in each part of the Schottky radiovoltaic battery is simulated to give a clue about how to make the battery work better. The power and energy-conversion efficiency of the tritium silicon Schottky radiovoltaic battery in an optimized design are simulated. Good consistency with experiments is obtained. PMID:22935439

  7. Optical response at 10.6 microns in tungsten silicide Schottky barrier diodes

    NASA Technical Reports Server (NTRS)

    Kumar, Sandeep; Boyd, Joseph T.; Jackson, Howard E.

    1987-01-01

    Optical response to radiation at a wavelength of 10.6 microns in tungsten silicide-silicon Schottky barrier diodes has been observed. Incident photons excite electrons by means of junction plasmon assisted inelastic electron tunneling. At 78 K, a peak in the second derivative of current versus junction bias voltage was observed at a voltage corresponding to the energy of photons having a wavelength of 10.6 microns. This peak increased with increasing incident laser power, saturating at the highest laser powers investigated.

  8. I- V characteristics of vanadium-flavonoid complexes based Schottky diodes

    NASA Astrophysics Data System (ADS)

    Karimov, Khasan S.; Mahroof-Tahir, Mohammad; Saleem, Muhammad; Ahmad, Zubair

    2011-08-01

    In this study, we have investigated the current-voltage characteristics of the Schottky diodes of two vanadium complexes, VO 2(3-fl) ( 1) (3-fl=3-hydroxyflavone) and VO(acac) 2 ( 2), (acac=acetylacetonate), and their composites with TiO 2. Thin films of vanadium complexes and their composites were deposited by the centrifugation method. Current-voltage characteristics of the samples were processed by the modified Shockley equation, Cheung functions and space-charge limited currents (SCLC) approaches. Different junction parameters, such as series resistances, reverse saturation currents, ideality factors and barrier height of the samples, were determined.

  9. Schottky diodes and ohmic contacts formed by thermally assisted photolytic laser chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Braichotte, D.; van den Bergh, H.

    Thermally assisted photolytic laser chemical vapor deposition (LCVD) of platinum on n-doped gallium arsenide, a two-phase hybrid scheme for the production of Schottky diodes, is discussed. The low temperature photolytic deposits of the initial slow phase contain a nonnegligible fraction of organic ligand material and tend to be amorphous. In the second phase, light absorption of the photolytically deposited metal causes a temperature rise which facilitates the removal of ligand material from the deposit, and which is sufficient for fast pyrolytic LCVD. Measurements of the influence of light intensity, in addition to metalorganic and inert gas pressure, on the deposition rates in both phases are obtained.

  10. Catalytic-Metal/PdO(sub x)/SiC Schottky-Diode Gas Sensors

    NASA Technical Reports Server (NTRS)

    Hunter, Gary W.; Xu, Jennifer C.; Lukco, Dorothy

    2006-01-01

    Miniaturized hydrogen- and hydrocarbon-gas sensors, heretofore often consisting of Schottky diodes based on catalytic metal in contact with SiC, can be improved by incorporating palladium oxide (PdOx, where 0 less than or equal to x less than or equal to 1) between the catalytic metal and the SiC. In prior such sensors in which the catalytic metal was the alloy PdCr, diffusion and the consequent formation of oxides and silicides of Pd and Cr during operation at high temperature were observed to cause loss of sensitivity. However, it was also observed that any PdOx layers that formed and remained at PdCr/SiC interfaces acted as barriers to diffusion, preventing further deterioration by preventing the subsequent formation of metal silicides. In the present improvement, the lesson learned from these observations is applied by placing PdOx at the catalytic metal/SiC interfaces in a controlled and uniform manner to form stable diffusion barriers that prevent formation of metal silicides. A major advantage of PdOx over other candidate diffusion-barrier materials is that PdOx is a highly stable oxide that can be incorporated into gas sensor structures by use of deposition techniques that are standard in the semiconductor industry. The PdOx layer can be used in a gas sensor structure for improved sensor stability, while maintaining sensitivity. For example, in proof-of-concept experiments, Pt/PdOx/SiC Schottky-diode gas sensors were fabricated and tested. The fabrication process included controlled sputter deposition of PdOx to a thickness of 50 Angstroms on a 400-m-thick SiC substrate, followed by deposition of Pt to a thickness of 450 Angstroms on the PdOx. The SiC substrate (400 microns in thickness) was patterned with photoresist and a Schottky-diode photomask. A lift-off process completed the definition of the Schottky-diode pattern. The sensors were tested by measuring changes in forward currents at a bias potential of 1 V during exposure to H2 in N2 at temperatures

  11. Rectifying properties of magnetite-based Schottky diode and the effects of magnetic field

    NASA Astrophysics Data System (ADS)

    Chen, Y. Z.; Sun, J. R.; Xie, Y. W.; Wang, D. J.; Lu, W. M.; Liang, S.; Shen, B. G.

    2007-04-01

    Rectifying properties, with and without magnetic field, of a high quality Fe3O4/SrTiO3:Nb Schottky diode have been experimentally studied. The junction exhibits an excellent rectifying behavior both below and above the Verwey temperature (TV) of Fe3O4. Magnetic field has a weak but visible effect on the transport process of the junction, producing a negative magnetoresistance for T TV. Based on an analysis of the current-voltage characteristics, the spin polarization of Fe3O4 has been deduced. It is a strong function of temperature, varying between -78% and 18%.

  12. Improvements on high voltage capacity and high temperature performances of Si-based Schottky potential barrier diode

    NASA Astrophysics Data System (ADS)

    Yongshun, Wang; Li, Rui; Ghaffar, Adnan; Zaixing, Wang; Chunjuan, Liu

    2015-02-01

    In order to improve the reverse voltage capacity and low junction temperature characteristics of the traditional silicon-based Schottky diode, a Schottky diode with high reverse voltage capacity and high junction temperature was fabricated using ion implantation, NiPt60 sputtering, silicide-forming and other major technologies on an N-type silicon epitaxial layer of 10.6-11.4 μm and (2.2-2.4) × 1015 cm-3 doping concentration. The measurement results show that the junction temperature of the Schottky diode fabricated can reach 175 °C, that is 50 °C higher than that of the traditional one; the reverse voltage capacity VR can reach 112 V, that is 80 V higher than that of the traditional one; the leakage current is only 2 μA and the forward conduction voltage drop is VF = 0.71 V at forward current IF = 3 A.

  13. Temperature dependence of the inhomogeneous parameters of the Mo/4H–SiC Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Latreche, A.; Ouennoughi, Z.; Weiss, R.

    2016-08-01

    The inhomogeneous parameters of Mo/4H–SiC Schottky barrier diodes were determined from current–voltage (I–V) characteristics in the temperature range of 303–498 K by using a general approach for the real Schottky diode. In this approach the total series resistances is divided into two resistances; the first one (R P) is the sum of the series resistances (r) of the particular diodes connected in parallel and the second is the common resistance (R C) to all particular diodes. The mean barrier height (\\bar{φ }) and the standard deviation (σ) decrease linearly with decreasing temperature and they are between the values for the diodes with the two limiting cases; no current spreading and full current spreading. The series resistance R C increases, while the series resistance R P slightly decreases with decreasing temperature.

  14. Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

    SciTech Connect

    Kasper, M.; Gramse, G.; Hoffmann, J.; Gaquiere, C.; Feger, R.; Stelzer, A.; Smoliner, J.; Kienberger, F.

    2014-11-14

    We measured the DC and RF impedance characteristics of micrometric metal-oxide-semiconductor (MOS) capacitors and Schottky diodes using scanning microwave microscopy (SMM). The SMM consisting of an atomic force microscopy (AFM) interfaced with a vector network analyser (VNA) was used to measure the reflection S11 coefficient of the metallic MOS and Schottky contact pads at 18 GHz as a function of the tip bias voltage. By controlling the SMM biasing conditions, the AFM tip was used to bias the Schottky contacts between reverse and forward mode. In reverse bias direction, the Schottky contacts showed mostly a change in the imaginary part of the admittance while in forward bias direction the change was mostly in the real part of the admittance. Reference MOS capacitors which are next to the Schottky diodes on the same sample were used to calibrate the SMM S11 data and convert it into capacitance values. Calibrated capacitance between 1–10 fF and 1/C{sup 2} spectroscopy curves were acquired on the different Schottky diodes as a function of the DC bias voltage following a linear behavior. Additionally, measurements were done directly with the AFM-tip in contact with the silicon substrate forming a nanoscale Schottky contact. Similar capacitance-voltage curves were obtained but with smaller values (30–300 aF) due to the corresponding smaller AFM-tip diameter. Calibrated capacitance images of both the MOS and Schottky contacts were acquired with nanoscale resolution at different tip-bias voltages.

  15. Graphite-graphene semiconductor junctions and magneto-dielectric coupling in Schottky diodes

    NASA Astrophysics Data System (ADS)

    Tongay, Sefaattin

    The goal of this dissertation is to incorporate graphite and graphene into today's semiconductor technology as a Schottky barrier diodes (metal/semiconductor junctions) that are widely used in metal semiconductor field effect transistors (MESFETs), high electron mobility transistors (HEMTs), high temperature and frequency devices, solar cells and sensors/detectors. The first part of the dissertation aims to give the reader a general idea about the physics at the metal-semiconductor junctions and essential theory background. The second chapter of the dissertation questions effects of temperature and magnetic field on the diode characteristics of Schottky junctions. In this chapter, we present observation of negative magnetocapacitance on GaAs:Si/Au junctions and fully equipped with the theory, we present a phenomenological explanation for the observed effect. In the third chapter, we for the first time introduce multi-layer-graphene as a metal (semimetal) electrode to form Schottky barriers on various technologically significant semiconductors such as Si, GaAs, SiC and GaN. Multi-layer-graphene/ semiconductor junctions not only display good current-voltage (I - V) and capacitance-voltage (C - V) characteristics but also are significant since the Schottky barrier height and characteristics are mainly governed by the interaction and bond formation at few layers on the metal and semiconductor interface. This automatically implies that the presented results also hold for graphene/semiconductor junctions. Chapter 4, takes the Schottky formation at the multi-layer-graphene(graphene)/ semiconductor junction to another level and aims to change the Fermi level of the metal electrode by intercalation with Bromine and tune the barrier height. Observed results are significant in MESFET technology since different barrier height are desired depending on the application. The remainder of the dissertation, focuses on the properties of graphite and graphene to have more

  16. Measuring size dependent electrical properties from nanoneedle structures: Pt/ZnO Schottky diodes

    SciTech Connect

    Mao, Shimin; Anderson, Daniel D.; Shang, Tao; Park, Byoungnam; Dillon, Shen J.

    2014-04-14

    This work reports the fabrication and testing of nanoneedle devices with well-defined interfaces that are amenable to a variety of structural and electrical characterization, including transmission electron microscopy. Single Pt/ZnO nanoneedle Schottky diodes were fabricated by a top down method using a combination of electro-polishing, sputtering, and focused ion beam milling. The resulting structures contained nanoscale planar heterojunctions with low ideality factors, the dimensions of which were tuned to study size-dependent electrical properties. The diameter dependence of the Pt/ZnO diode barrier height is explained by a joule heating effect and/or electronic inhomogeneity in the Pt/ZnO contact area.

  17. A millimeter wave large-signal model of GaAs planar Schottky varactor diodes

    NASA Astrophysics Data System (ADS)

    Junrong, Dong; Jie, Huang; Chao, Tian; Hao, Yang; Haiying, Zhang

    2011-03-01

    A millimeter wave large-signal model of GaAs planar Schottky varactor diodes based on a physical analysis is presented. The model consists of nonlinear resistances and capacitances of the junction region and external parasitic parameters. By analyzing the characteristics of the diode under reverse and forward bias, an extraction procedure of all of the parameters is addressed. To validate the newly proposed model, the PSVDs were fabricated based on a planar process and were measured using an automatic network analyzer. Measurement shows that the model exactly represents the behavior of GaAs PSVDs under a wide bias condition from -10 to 0.6 V and for frequencies up to 40 GHz.

  18. Modeling of Kink-Shaped Carbon-Nanotube Schottky Diode with Gate Bias Modulation

    NASA Technical Reports Server (NTRS)

    Yamada, Toshishige; Biegel, Bryan (Technical Monitor)

    2001-01-01

    A model is proposed for the recent gate-voltage (V(sub G)) modulation experiment of a kink-shaped carbon nanotube (NT) Schottky diode. Since larger V(sub G) increases both the forward and the reverse turn-on voltages of the diode in the experiment, we show that: (1) the rectification must occur at the kink where the metallic and the semiconducting NTs meet, and not at the electrode contact, and (2) the semiconducting NT must be n-type. The turn-on voltages are derived analytically as a function of V(sub G) with the electrode contact contribution and a good agreement is obtained with the experimental data.

  19. TCAD simulation for alpha-particle spectroscopy using SIC Schottky diode.

    PubMed

    Das, Achintya; Duttagupta, Siddhartha P

    2015-12-01

    There is a growing requirement of alpha spectroscopy in the fields context of environmental radioactive contamination, nuclear waste management, site decommissioning and decontamination. Although silicon-based alpha-particle detection technology is mature, high leakage current, low displacement threshold and radiation hardness limits the operation of the detector in harsh environments. Silicon carbide (SiC) is considered to be excellent material for radiation detection application due to its high band gap, high displacement threshold and high thermal conductivity. In this report, an alpha-particle-induced electron-hole pair generation model for a reverse-biased n-type SiC Schottky diode has been proposed and verified using technology computer aided design (TCAD) simulations. First, the forward-biased I-V characteristics were studied to determine the diode ideality factor and compared with published experimental data. The ideality factor was found to be in the range of 1.4-1.7 for a corresponding temperature range of 300-500 K. Next, the energy-dependent, alpha-particle-induced EHP generation model parameters were optimised using transport of ions in matter (TRIM) simulation. Finally, the transient pulses generated due to alpha-particle bombardment were analysed for (1) different diode temperatures (300-500 K), (2) different incident alpha-particle energies (1-5 MeV), (3) different reverse bias voltages of the 4H-SiC-based Schottky diode (-50 to -250 V) and (4) different angles of incidence of the alpha particle (0°-70°).The above model can be extended to other (wide band-gap semiconductor) device technologies useful for radiation-sensing application. PMID:25634901

  20. Vertically grown Ge nanowire Schottky diodes on Si and Ge substrates

    NASA Astrophysics Data System (ADS)

    Chandra, Nishant; Tracy, Clarence J.; Cho, Jeong-Hyun; Picraux, S. T.; Hathwar, Raghuraj; Goodnick, Stephen M.

    2015-07-01

    The processing and performance of Schottky diodes formed from arrays of vertical Ge nanowires (NWs) grown on Ge and Si substrates are reported. The goal of this work is to investigate CMOS compatible processes for integrating NWs as components of vertically scaled integrated circuits, and elucidate transport in vertical Schottky NWs. Vertical phosphorus (P) doped Ge NWs were grown using vapor-liquid-solid epitaxy, and nickel (Ni)-Ge Schottky contacts were made to the tops of the NWs. Current-voltage (I-V) characteristics were measured for variable ranges of NW diameters and numbers of nanowires in the arrays, and the I-V characteristics were fit using modified thermionic emission theory to extract the barrier height and ideality factor. As grown NWs did not show rectifying behavior due to the presence of heavy P side-wall doping during growth, resulting in a tunnel contact. After sidewall etching using a dilute peroxide solution, rectifying behavior was obtained. Schottky barrier heights of 0.3-0.4 V and ideality factors close to 2 were extracted using thermionic emission theory, although the model does not give an accurate fit across the whole bias range. Attempts to account for enhanced side-wall conduction due to non-uniform P doping profile during growth through a simple shunt resistance improve the fit, but are still insufficient to provide a good fit. Full three-dimensional numerical modeling using Silvaco Atlas indicates that at least part of this effect is due to the presence of fixed charge and acceptor like traps on the NW surface, which leads to effectively high ideality factors.

  1. A monolithically integrated power JFET and Junction Barrier Schottky diode in 4H Silicon Carbide

    NASA Astrophysics Data System (ADS)

    Radhakrishnan, Rahul

    Efficiency of power management circuits depends significantly on their constituent switches and rectifiers. The demands of technology are increasingly running up against the intrinsic properties of Si based power devices. 4H-Silicon Carbide (SiC) has superior properties that make it attractive for high power applications. SiC rectifiers are already a competitive choice and SiC switches have also been commercialized recently. Junction Barrier Schottky (JBS) diodes, which combine the advantages of PN and Schottky, have higher Figure of Merit (FOM) as rectifiers. Among switches, a robust and mature process has been developed for Silicon Carbide Vertical Junction Field Effect Transistors (VJFETs), which currently gives it the highest unipolar FOM. Switches are frequently combined with anti-parallel diodes in power circuits. This thesis describes the development of a SiC-based monolithically integrated power switch and diode. Monolithic integration increases reliability and efficiency, and reduces cost. Because of their superior properties and similarities in fabrication, we chose the SiC VJFET and JBS diode as the switch and rectifier. Detailed design, fabrication and characterization of the integrated switch to block above 800 V and conduct current beyond 100 A/cm2 is explained. In this process, the first physics-based 2-D compact model is developed for reverse leakage in a JBS diode as a function of design parameters. Since the gate-channel junctions of SiC VJFETs cannot be assumed to be abrupt, an existing analytical model for Si VJFETs is extended to account for graded gate-channel junctions. Using these analytical models, design rules are developed for the VJFET and JBS diode. Finite element simulations are used to find the best anode layout of the JBS diode and optimize electric field termination in the integrated device to ensure their capability to operate at high voltage. Finally, a spin-on glass based process is developed for filling the gate trenches of the

  2. Flexible indium-gallium-zinc-oxide Schottky diode operating beyond 2.45 GHz

    NASA Astrophysics Data System (ADS)

    Zhang, Jiawei; Li, Yunpeng; Zhang, Binglei; Wang, Hanbin; Xin, Qian; Song, Aimin

    2015-07-01

    Mechanically flexible mobile phones have been long anticipated due to the rapid development of thin-film electronics in the last couple of decades. However, to date, no such phone has been developed, largely due to a lack of flexible electronic components that are fast enough for the required wireless communications, in particular the speed-demanding front-end rectifiers. Here Schottky diodes based on amorphous indium-gallium-zinc-oxide (IGZO) are fabricated on flexible plastic substrates. Using suitable radio-frequency mesa structures, a range of IGZO thicknesses and diode sizes have been studied. The results have revealed an unexpected dependence of the diode speed on the IGZO thickness. The findings enable the best optimized flexible diodes to reach 6.3 GHz at zero bias, which is beyond the critical benchmark speed of 2.45 GHz to satisfy the principal frequency bands of smart phones such as those for cellular communication, Bluetooth, Wi-Fi and global satellite positioning.

  3. Flexible indium-gallium-zinc-oxide Schottky diode operating beyond 2.45 GHz.

    PubMed

    Zhang, Jiawei; Li, Yunpeng; Zhang, Binglei; Wang, Hanbin; Xin, Qian; Song, Aimin

    2015-01-01

    Mechanically flexible mobile phones have been long anticipated due to the rapid development of thin-film electronics in the last couple of decades. However, to date, no such phone has been developed, largely due to a lack of flexible electronic components that are fast enough for the required wireless communications, in particular the speed-demanding front-end rectifiers. Here Schottky diodes based on amorphous indium-gallium-zinc-oxide (IGZO) are fabricated on flexible plastic substrates. Using suitable radio-frequency mesa structures, a range of IGZO thicknesses and diode sizes have been studied. The results have revealed an unexpected dependence of the diode speed on the IGZO thickness. The findings enable the best optimized flexible diodes to reach 6.3 GHz at zero bias, which is beyond the critical benchmark speed of 2.45 GHz to satisfy the principal frequency bands of smart phones such as those for cellular communication, Bluetooth, Wi-Fi and global satellite positioning. PMID:26138510

  4. Laterally Inhomogeneous Barrier Analysis Using Capacitance-Voltage Characteristics of Identically Fabricated Schottky Diodes

    NASA Astrophysics Data System (ADS)

    Çavdar, Şükrü; Tuğluoğlu, Nihat; Akgül, Kübra Bengin; Koralay, Haluk

    2016-08-01

    Au Schottky contacts (50 dots) on n-Si (100) were fabricated by thermal evaporation under the same conditions. The mean of the electrical parameters of the diodes were investigated by means of capacitance-voltage ( C- V) measurements at 1 MHz. Even if the diodes were all equally fabricated, there was a diode-to-diode change. The values of barrier height (ΦB) were determined from the C -2- V characteristics, which ranged from 0.812 eV to 0.837 eV. The Gaussian fit of the barrier height distributions gave a mean of barrier height value of 0.822 eV and a standard value of 0.005 eV. Furthermore, the mean values of other parameters such as the carrier donor concentration ( N D), the diffusion potential at zero bias ( V 0), the Fermi level ( E F), the image force lowering (ΔΦb) and the space charge layer width ( W D) were investigated and determined to be 1.311 × 1015 cm-3, 0.575 V, 0.257 eV, 1.363 × 10-2 eV, and 7.573 × 10-5 cm, respectively.

  5. Layer dependence and gas molecule absorption property in MoS2 Schottky diode with asymmetric metal contacts

    PubMed Central

    Yoon, Hyong Seo; Joe, Hang-Eun; Jun Kim, Sun; Lee, Hee Sung; Im, Seongil; Min, Byung-Kwon; Jun, Seong Chan

    2015-01-01

    Surface potential measurement on atomically thin MoS2 flakes revealed the thickness dependence in Schottky barriers formed between high work function metal electrodes and MoS2 thin flakes. Schottky diode devices using mono- and multi- layer MoS2 channels were demonstrated by employing Ti and Pt contacts to form ohmic and Schottky junctions respectively. Characterization results indicated n-type behavior of the MoS2 thin flakes and the devices showed clear rectifying performance. We also observed the layer dependence in device characteristics and asymmetrically enhanced responses to NH3 and NO2 gases based on the metal work function and the Schottky barrier height change. PMID:25990304

  6. Role of self-trapped holes in the photoconductive gain of β-gallium oxide Schottky diodes

    DOE PAGESBeta

    Armstrong, Andrew M.; Crawford, Mary H.; Jayawardena, Asanka; Ahyi, Ayayi; Dhar, Sarit

    2016-03-10

    Solar-blind photodetection and photoconductive gain > 50 corresponding to a responsivity > 8 A/W was observed for β-Ga2O3 Schottky photodiodes. We investigated the origin of photoconductive gain. Current-voltage characteristics of the diodes did not indicate avalanche breakdown, which excludes carrier multiplication by impact ionization as the source for gain. However, photocapacitance measurements indicated a mechanism for hole localization for above-band gap illumination, suggesting self-trapped hole formation. Comparison of photoconductivity and photocapacitance spectra indicated that self-trapped hole formation coincides with the strong photoconductive gain. We conclude that self-trapped hole formation near the Schottky diode lowers the effective Schottky barrier in reversemore » bias, producing photoconductive gain. Ascribing photoconductive gain to an inherent property like self-trapping of holes can explain the operation of a variety of β-Ga2O3 photodetectors.« less

  7. Role of self-trapped holes in the photoconductive gain of β-gallium oxide Schottky diodes

    NASA Astrophysics Data System (ADS)

    Armstrong, Andrew M.; Crawford, Mary H.; Jayawardena, Asanka; Ahyi, Ayayi; Dhar, Sarit

    2016-03-01

    Solar-blind photodetection and photoconductive gain >50 corresponding to a responsivity >8 A/W were observed for β-Ga2O3 Schottky photodiodes. The origin of photoconductive gain was investigated. Current-voltage characteristics of the diodes did not indicate avalanche breakdown, which excludes carrier multiplication by impact ionization as the source for gain. However, photocapacitance measurements indicated a mechanism for hole localization for above-band gap illumination, suggesting self-trapped hole formation. Comparison of photoconductivity and photocapacitance spectra indicated that self-trapped hole formation coincides with the strong photoconductive gain. It is concluded that self-trapped hole formation near the Schottky diode lowers the effective Schottky barrier in reverse bias, producing photoconductive gain. Ascribing photoconductive gain to an inherent property like self-trapping of holes can explain the operation of a variety of β-Ga2O3 photodetectors.

  8. Fabrication and characterization of magnetically tunable metal-semiconductor schottky diode using barium hexaferrite thin film on gold

    NASA Astrophysics Data System (ADS)

    Kaur, Jotinder; Sharma, Vinay; Sharma, Vipul; Veerakumar, V.; Kuanr, Bijoy K.

    2016-05-01

    Barium Hexaferrite (BaM) is an extensively studied magnetic material due to its potential device application. In this paper, we study Schottky junction diodes fabricated using gold and BaM and demonstrate the function of a spintronic device. Gold (50 nm)/silicon substrate was used to grow the BaM thin films (100-150 nm) using pulsed laser deposition. I-V characteristics were measured on the Au/BaM structure sweeping the voltage from ±5 volts. The forward and reverse bias current-voltage curves show diode like rectifying characteristics. The threshold voltage decreases while the output current increases with increase in the applied external magnetic field showing that the I-V characteristics of the BaM based Schottky junction diodes can be tuned by external magnetic field. It is also demonstrated that, the fabricated Schottky diode can be used as a half-wave rectifier, which could operate at high frequencies in the range of 1 MHz compared to the regular p-n junction diodes, which rectify below 10 kHz. In addition, it is found that above 1 MHz, Au/BaM diode can work as a rectifier as well as a capacitor filter, making the average (dc) voltage much larger.

  9. Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers

    NASA Astrophysics Data System (ADS)

    Yuryev, V. A.; Chizh, K. V.; Chapnin, V. A.; Mironov, S. A.; Dubkov, V. P.; Uvarov, O. V.; Kalinushkin, V. P.; Senkov, V. M.; Nalivaiko, O. Y.; Novikau, A. G.; Gaiduk, P. I.

    2015-05-01

    Platinum silicide Schottky diodes formed on films of polycrystalline Si doped by phosphorus are demonstrated to be efficient and manufacturable CMOS-compatible temperature sensors for microbolometer detectors of radiation. Thin-film platinum silicide/poly-Si diodes have been produced by a CMOS-compatible process on artificial Si3N4/SiO2/Si(001) substrates simulating the bolometer cells. Layer structure and phase composition of the original Pt/poly-Si films and the Pt silicide/poly-Si films synthesized by a low-temperature process have been studied by means of the scanning transmission electron microscopy; they have also been explored by means of the two-wavelength X-ray structural phase analysis and the X-ray photoelectron spectroscopy. Temperature coefficient of voltage for the forward current of a single diode is shown to reach the value of about -2%/ °C in the temperature interval from 25 to 50 °C.

  10. Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers

    SciTech Connect

    Yuryev, V. A. Chizh, K. V.; Chapnin, V. A.; Mironov, S. A.; Dubkov, V. P.; Uvarov, O. V.; Kalinushkin, V. P.; Senkov, V. M.; Nalivaiko, O. Y.; Novikau, A. G.; Gaiduk, P. I.

    2015-05-28

    Platinum silicide Schottky diodes formed on films of polycrystalline Si doped by phosphorus are demonstrated to be efficient and manufacturable CMOS-compatible temperature sensors for microbolometer detectors of radiation. Thin-film platinum silicide/poly-Si diodes have been produced by a CMOS-compatible process on artificial Si{sub 3}N{sub 4}/SiO{sub 2}/Si(001) substrates simulating the bolometer cells. Layer structure and phase composition of the original Pt/poly-Si films and the Pt silicide/poly-Si films synthesized by a low-temperature process have been studied by means of the scanning transmission electron microscopy; they have also been explored by means of the two-wavelength X-ray structural phase analysis and the X-ray photoelectron spectroscopy. Temperature coefficient of voltage for the forward current of a single diode is shown to reach the value of about −2%/ °C in the temperature interval from 25 to 50 °C.

  11. Effect of nanopatches on electrical behavior of Ni/n-type Si Schottky diode

    NASA Astrophysics Data System (ADS)

    Rahmatallahpur, Sh.; Yegane, M.

    2011-04-01

    Topological surface measurement of thin metal film using a conducting probe atomic force microscope (C-AFM) shows that thin metal film deposited on Ni/n-Si Schottky diode (SD) consists of patches. These patches are sets of parallel connected and electrically cooperating nano-contacts of size between 50 and 100nm. Every individual patch acts as an individual diode with different I- V curve, barrier height (BH) and ideality factor ( n). Between these diodes or patches, there are spot field distributions; the patches with different local work functions are in direct electric contact with surrounding patches. As a result, a potential difference between surfaces of patches, the so-called electrostatic spot field Ef, is formed. It is shown that in real metal-semiconductor (MS) contacts, patches with quite different configurations, various geometrical sizes and local work functions are randomly distributed on the surface of metal; hence direction and intensity of spot field are non-uniformly distributed along the surface of metal. There is a linear dependence between barrier height and ideality factor, which is the consequence of reduction of distance of the maximum of BH from the interface. This dependency is the sign of reduction of contribution of a peripheral current.

  12. Electrical Characterization of High Energy Electron Irradiated Ni/4H-SiC Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Paradzah, A. T.; Omotoso, E.; Legodi, M. J.; Auret, F. D.; Meyer, W. E.; Diale, M.

    2016-05-01

    The effect of high energy electron irradiation on Ni/4H-SiC Schottky barrier diodes was evaluated by current-voltage (I-V) and capacitance-voltage (C-V) measurements at room temperature. Electron irradiation was achieved by using a radioactive strontium source with peak emission energy of 2.3 MeV. Irradiation was performed in fluence steps of 4.9 × 1013 cm-2 until a total fluence of 5.4 × 1014 cm-2 was reached. The Schottky barrier height determined from I-V measurements was not significantly changed by irradiation while that obtained from C-V measurements increased with irradiation. The ideality factor was obtained before irradiation as 1.05 and this value did not significantly change as a result of irradiation. The series resistance increased from 47 Ω before irradiation to 74 Ω after a total electron fluence of 5.4 × 1014 cm-2. The net donor concentration decreased with increasing irradiation fluence from 4.6 × 1014 cm-3 to 3.0 × 1014 cm-3 from which the carrier removal rate was calculated to be 0.37 cm-1.

  13. Electrical Characterization of High Energy Electron Irradiated Ni/4 H-SiC Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Paradzah, A. T.; Omotoso, E.; Legodi, M. J.; Auret, F. D.; Meyer, W. E.; Diale, M.

    2016-08-01

    The effect of high energy electron irradiation on Ni/4 H-SiC Schottky barrier diodes was evaluated by current-voltage ( I- V) and capacitance-voltage ( C- V) measurements at room temperature. Electron irradiation was achieved by using a radioactive strontium source with peak emission energy of 2.3 MeV. Irradiation was performed in fluence steps of 4.9 × 1013 cm-2 until a total fluence of 5.4 × 1014 cm-2 was reached. The Schottky barrier height determined from I- V measurements was not significantly changed by irradiation while that obtained from C- V measurements increased with irradiation. The ideality factor was obtained before irradiation as 1.05 and this value did not significantly change as a result of irradiation. The series resistance increased from 47 Ω before irradiation to 74 Ω after a total electron fluence of 5.4 × 1014 cm-2. The net donor concentration decreased with increasing irradiation fluence from 4.6 × 1014 cm-3 to 3.0 × 1014 cm-3 from which the carrier removal rate was calculated to be 0.37 cm-1.

  14. Schottky diode characteristics and 1/f noise of high sensitivity reduced graphene oxide/Si heterojunction photodetector

    NASA Astrophysics Data System (ADS)

    Zhu, Miao; Li, Xinming; Li, Xiao; Zang, Xiaobei; Zhen, Zhen; Xie, Dan; Fang, Ying; Zhu, Hongwei

    2016-03-01

    Reduced graphene oxide (RGO)/Si Schottky diode has been reported nowadays to show excellent performances in photodetection and other photoelectrical devices. Different from pure graphene, there are large amounts of function groups and structural defects left on the base plane of RGO, which may influence the interfacial properties of RGO/Si Schottky diode. Herein, the barrier inhomogeneity and junction characteristics were systematically investigated to help to describe the interface of RGO/Si diode. From the perspective of its applications, the influences of gas molecule and noise properties are considered to be important. Thus, the photovoltaic performance of RGO/Si devices in air and vacuum is investigated to analyze their effects. Meanwhile, 1/f noise of RGO/Si diodes is investigated under air/vacuum conditions and varied temperatures. It is found that the devices in vacuum and under higher power incident light show much lower 1/f noise. These results are meaningful to the noise control and performance improvement in the development of Schottky diode based devices.

  15. Normally-Off AlGaN/GaN-on-Si Power Switching Device with Embedded Schottky Barrier Diode

    NASA Astrophysics Data System (ADS)

    Park, Bong-Ryeol; Lee, Jae-Gil; Cha, Ho-Young

    2013-03-01

    We have demonstrated a novel AlGaN/GaN power switching device with an embedded Schottky barrier diode. The normally-off transistor mode was implemented with a recessed metal-oxide-semiconductor heterostructure field-effect transistor (MOSHFET) configuration in which a Schottky barrier diode (SBD) was embedded to flow the reverse current. The proposed device is very promising for use in high-efficiency converter and inverter ICs. The prototype device exhibited encouraging characteristics: a turn-on voltage of 2 V for the transistor and a forward turn-on voltage of 0.8 V for the embedded diode. The breakdown voltage for the anode-to-cathode distance of 10 µm was 966 V.

  16. Analysis on partial thermal resistances of packaged SiC schottky barrier diodes at elevated temperatures

    NASA Astrophysics Data System (ADS)

    Kim, Taehwa; Funaki, Tsuyoshi

    2016-04-01

    This paper investigates the temperature dependence of partial thermal resistances of a packaged SiC schottky barrier diode (SBD) for high temperature applications. Transient thermal resistances of the packaged SiC SBD were measured and characterized in temperature range from 27 to 275 °C. The partial thermal resistances were extracted and analyzed using the cumulative and differential thermal structure functions. The extracted partial thermal resistances were compared to the results from the finite difference thermal model, and both results were in good agreement. The temperature dependence of the partial thermal resistance of the SiC device and the Si3N4 substrate contributes to the overall thermal characteristics variation of the packaged SiC SBD.

  17. Note: Measuring dezincification of brass by Schottky barrier diodes formed between semiconductor corrosion products and brass

    NASA Astrophysics Data System (ADS)

    Bond, J. W.

    2010-10-01

    A newly developed method is presented for measuring dezincification on the surface of brass from a consideration of the forward and reverse bias potential drop across a Schottky barrier diode formed between n-type zinc oxide or p-type copper (I) oxide corrosion products and the brass substrate. Electrical connection to the corrosion product is made with zinc and platinum tipped probes, approximately 1 mm diameter. Comparison with x-ray photoelectron spectroscopy shows the difference between the forward and reverse bias potential drop to be dependent on the relative abundance of the corrosion products and the work function of the metal probe. This difference, for a zinc tipped probe, gives a statistically significant correlation to the surface zinc to copper ratio and the degree of dezincification. Details of the setup, operation, and testing of a portable instrument designed to measure dezincification of brass by this method are given.

  18. Evaluation of Schottky barrier diodes fabricated directly on processed 4H-SiC(0001) surfaces.

    PubMed

    Sano, Yasuhisa; Shirasawa, Yuki; Okamoto, Takeshi; Yamauchi, Kazuto

    2011-04-01

    Silicon carbide (SiC) is a suitable substrate for low-power-consumption power devices and high-temperature applications. However, this material is difficult to machine because of its hardness and chemical inertness, and many machining methods have been studied intensively in recent years. In this paper, we present a simple method to evaluate the electrical properties of the processed surface using the ideal factor n of a Schottky barrier diode (SBD) fabricated directly on the processed surface. Upon comparing the values of n for SBDs fabricated on a damaged SiC surface and a non-damaged SiC surface, we found that there is a significant difference in the dispersion and magnitude of n. Furthermore, by combining this technique with slope etching, we were able to estimate the thickness of the damaged sub-surface layer. PMID:21776636

  19. The studies of Schottky-diode based co-plane detector for surface plasmon resonance sensing

    NASA Astrophysics Data System (ADS)

    Liu, Chien-Sheng; Wen, Tsun-Yu; Wang, Da-Shin; Lin, Chii-Wann

    2010-08-01

    The Surface Plasmon Resonance (SPR) is a label-free, highly sensitive and real time sensing technique and has been extensively applied to biosensing and assay for decades. In a conventional SPR biosensor, a prism is used to create the total reflection in which the evanescent wave can excite the surface plasmon mode at the metal-dielectric interface at certain angle, at which condition the reflectivity of incident TM-polarized vanished as measured by a far-field photodetector. This is the optical detection of surface plasmon resonance. In this research, zinc oxide (ZnO) was used as the dielectric thin-film material above the gold surface on the glass substrate to form a co-plane Schottky diode; this structure is designed to be an alternative way to detect SPR. The strength of plasmonic field is possible to be monitored by measuring the photocurrent under the reverse bias. According to our experimental results, the measured photocurrents with TM-polarized illumination (representing the SPR case), TE-polarized illumination (non-SPR case) and no illumination conditions under DC -1.5V bias are -76.158mA (2.5μA), -76.085mA (3.6μA) and -76.089mA (3.4μA), respectively. Based on the results, we have demonstrated this Schottky diode based co-plane device has the potential to be used as the SPR detector and provides a possible solution for the need of a low-cost, miniaturized, electronically integrated, and portable SPR biosensor in the near future.

  20. Thermal stability study of semimetal graphite n-InP and n-GaN Schottky diodes

    NASA Astrophysics Data System (ADS)

    Yatskiv, R.; Grym, J.

    2013-05-01

    The electrical properties of highly rectifying semimetal-graphite Schottky contacts fabricated by printing colloid graphite on n-type InP and GaN are investigated as a function of annealing temperature by current-voltage and capacitance-voltage techniques. As-deposited Schottky diodes exhibit excellent current-voltage rectifying characteristics of 7.5 × 107 and 1.9 × 1011 with Schottky barrier height of 1.13 and 1.29 eV at room temperature for InP and GaN, respectively. The key aspect of this technique, compared with conventional vacuum evaporation, is low deposition energy process, leaving the surface undisturbed.

  1. Graphite/CdMnTe Schottky diodes and their electrical characteristics

    NASA Astrophysics Data System (ADS)

    Kosyachenko, L. A.; Yatskiv, R.; Yurtsenyuk, N. S.; Maslyanchuk, O. L.; Grym, J.

    2014-01-01

    The first Schottky diodes based on n-CdMnTe crystals with pronounced rectifying properties are investigated. It is shown that the I-V characteristics of the diodes fabricated by printing colloidal graphite can be described by the Sah-Noyce-Shockley theory of generation-recombination in the space charge region. Exponential increase of forward current with voltage is limited by a relatively low barrier height at the graphite/CdMnTe contact (˜ 0.4 eV) and a significant series resistance of the crystal bulk (˜ 106 Ω at room temperature). Tunneling due to high concentration of uncompensated impurities in investigated Cd0.9Mn0.1Te crystals (7 × 1017 cm-3) does not allow increasing the reverse bias voltage to the values needed for the operation of x- and γ-ray detectors. High concentration of uncompensated donors is interpreted by the fact that a certain part of the Mn atoms does not substitute for Cd but plays a role of over-stoichiometric impurities. In the case of the presence of a thin intermediate insulator layer in the graphite/CdMnTe contact, a rapid increase in the current for both polarities of high voltage due to the Frenkel-Poole emission is observed. The obtained results shed light on the problems of technology of growing and post-processing CdMnTe crystals regarded as a prospective material for x- and γ-ray detectors.

  2. Localized-surface-plasmon-enhanced multifunction silicon nanomembrane Schottky diodes based on Au nanoparticles

    NASA Astrophysics Data System (ADS)

    Ha, Hyeon Jun; Kang, Byung Hyun; Yeom, Seung-Won; Park, Junsu; Lee, Yun-Hi; Ju, Byeong-Kwon

    2015-12-01

    Au nanoparticle (NP)-modified Si nanomembrane (Si NM) Schottky barrier diodes (SBDs) were fabricated by using a transfer-printing method to create pedestals using only one photomask on a flexible substrate. The transfer using the pedestals afforded a yield of >95% with no significant cracks. The plasmonic Au NPs can facilitate the improvement of the incident optical absorption. The Au NP-modified Si NM SBD exhibited enhanced photoresponse characteristics with an external quantum efficiency ({{\\boldsymbol{η }}}{{EQE}}) of 34%, a photosensitivity ({\\boldsymbol{P}}) of 27 at a voltage bias of -5 V, a light intensity of 1.2 W cm-2, and a responsivity ({{\\boldsymbol{R}}}{{ph}}) of 0.21 A W-1. Additionally, the mechanical bending characteristics of the device were observed while a compressive strain up to 0.62% was applied to the diode. The results suggest that the Au NP-modified Si NM SBD has great potential for use in multifunction devices as a strain sensor and photosensor.

  3. Localized-surface-plasmon-enhanced multifunction silicon nanomembrane Schottky diodes based on Au nanoparticles.

    PubMed

    Ha, Hyeon Jun; Kang, Byung Hyun; Yeom, Seung-Won; Park, Junsu; Lee, Yun-Hi; Ju, Byeong-Kwon

    2015-12-01

    Au nanoparticle (NP)-modified Si nanomembrane (Si NM) Schottky barrier diodes (SBDs) were fabricated by using a transfer-printing method to create pedestals using only one photomask on a flexible substrate. The transfer using the pedestals afforded a yield of >95% with no significant cracks. The plasmonic Au NPs can facilitate the improvement of the incident optical absorption. The Au NP-modified Si NM SBD exhibited enhanced photoresponse characteristics with an external quantum efficiency (η(EQE)) of 34%, a photosensitivity (P) of 27 at a voltage bias of -5 V, a light intensity of 1.2 W cm(-2), and a responsivity (R(ph)) of 0.21 A W(-1). Additionally, the mechanical bending characteristics of the device were observed while a compressive strain up to 0.62% was applied to the diode. The results suggest that the Au NP-modified Si NM SBD has great potential for use in multifunction devices as a strain sensor and photosensor. PMID:26541294

  4. Inhomogeneous barrier height effect on the current-voltage characteristics of an Au/n-InP Schottky diode

    NASA Astrophysics Data System (ADS)

    Zeghdar, Kamal; Dehimi, Lakhdar; Saadoune, Achour; Sengouga, Nouredine

    2015-12-01

    We report the current-voltage (I-V) characteristics of the Schottky diode (Au/n-InP) as a function of temperature. The SILVACO-TCAD numerical simulator is used to calculate the I-V characteristic in the temperature range of 280-400 K. This is to study the effect of temperature on the I-V curves and assess the main parameters that characterize the Schottky diode such as the ideality factor, the height of the barrier and the series resistance. The I-V characteristics are analyzed on the basis of standard thermionic emission (TE) theory and the inhomogeneous barrier heights (BHs) assuming a Gaussian distribution. It is shown that the ideality factor decreases while the barrier height increases with increasing temperature, on the basis of TE theory. Furthermore, the homogeneous BH value of approximately 0.524 eV for the device has been obtained from the linear relationship between the temperature-dependent experimentally effective BHs and ideality factors. The modified Richardson plot, according to the inhomogeneity of the BHs, has a good linearity over the temperature range. The evaluated Richardson constant A* was 10.32 A·cm-2·K-2, which is close to the theoretical value of 9.4 A·cm-2·K-2 for n-InP. The temperature dependence of the I-V characteristics of the Au/n-InP Schottky diode have been successfully explained on the basis of the thermionic emission (TE) mechanism with a Gaussian distribution of the Schottky barrier heights (SBHs). Simulated I-V characteristics are in good agreement with the measurements [Korucu D, Mammadov T S. J Optoelectronics Advanced Materials, 2012, 14: 41]. The barrier height obtained using Gaussian Schottky barrier distribution is 0.52 eV, which is about half the band gap of InP.

  5. Electrical transport characterization of PEDOT:PSS/n-Si Schottky diodes and their applications in solar cells.

    PubMed

    Khurelbaatar, Zagarzusem; Hyung, Jung-Hwan; Kim, Gil-Sung; Park, No-Won; Shim, Kyu-Hwan; Lee, Sang-Kwon

    2014-06-01

    We demonstrate locally contacted PEDOT:PSS Schottky diodes with excellent rectifying behavior, fabricated on n-type Si substrates using a spin-coating process and a reactive-ion etching process. Electrical transport characterizations of these Schottky diodes were investigated by both current-voltage (I-V) and capacitance-voltage (C-V) measurements. We found that these devices exhibit excellent modulation in the current with an on/off ratio of - 10(6). Schottky junction solar cells composed of PEDOT:PSS and n-Si structures were also examined. From the current density-voltage (J-V) measurement of a solar cell under illumination, the short circuit current (I(sc)), open circuit voltage (V(oc)), and conversion efficiency (eta) were - 19.7 mA/cm2, - 578.5 mV, and - 6.5%, respectively. The simple and low-cost fabrication process of the PEDOT:PSS/n-Si Schottky junctions makes them a promising candidate for further high performance solar cell applications. PMID:24738402

  6. Study of transport properties of copper/zinc-oxide-nanorods-based Schottky diode fabricated on textile fabric

    NASA Astrophysics Data System (ADS)

    Khan, Azam; Hussain, Mushtaque; Abbasi, Mazhar Ali; Hussain Ibupoto, Zafar; Nur, Omer; Willander, Magnus

    2013-12-01

    In this work, a copper/zinc-oxide (ZnO)-nanorods-based Schottky diode was fabricated on the textile fabric substrate. ZnO nanorods were grown on a silver-coated textile fabric substrate by using the hydrothermal route. Scanning electron microscopy and x-ray diffraction techniques were used for the structural study. The electrical characterization of copper/ZnO-nanorods-based Schottky diodes was investigated by using a semiconductor parameter analyzer and an impedance spectrometer. The current density-voltage (J-V) and capacitance-voltage (C-V) measurements were used to estimate the electrical parameters. The threshold voltage (Vth), ideality factor (η), barrier height (ϕb), reverse saturation current density (Js), carrier concentration (ND) and built-in potential (Vbi) were determined by using experimental data and (simulated) curve fitting. This study describes the possible fabrication of electronic and optoelectronic devices on textile fabric substrate with an acceptable performance.

  7. Studies on metal/n-GaAs Schottky barrier diodes: The effects of temperature and carrier concentrations

    SciTech Connect

    Mangal, Sutanu; Banerji, P.

    2009-04-15

    Metal/Semiconductor Schottky diodes were fabricated to study the effect of temperature and carrier concentrations on diode parameters, such as ideality factor and barrier heights. The diodes were formed on the epitaxial layers of metal organic chemical vapor deposition (MOCVD) grown n-GaAs with metals such as Al, Pd, and Zn-Pd deposited onto n-GaAs by thermal evaporation technique. Trimethyl gallium and AsH{sub 3} were used as Ga and As precursors, respectively, to grow GaAs on semi-insulating GaAs substrates at 600 deg. C and H{sub 2}S was used for n-type doping in a horizontal reactor atmospheric pressure MOCVD system. The Schottky diodes were characterized by forward bias current-voltage measurements in the temperature range 130-300 K and capacitance-voltage measurement at room temperature and diode parameters such as ideality factor and barrier height have been evaluated. It is found that the Schottky barrier height decreases with decrease in temperature while the ideality factor increases. It is also observed that the barrier height increases linearly with the applied forward bias voltage and the rate of change of barrier height with voltage increases for higher carrier concentration of the semiconductor. The carrier concentration of n-GaAs was chosen in the regime 1x10{sup 16}-8.2x10{sup 16} cm{sup -3} so that the depletion region extends inside the semiconductor and the diode can be used as a III-V photovoltaic device.

  8. Franz–Keldysh effect in n-type GaN Schottky barrier diode under high reverse bias voltage

    NASA Astrophysics Data System (ADS)

    Maeda, Takuya; Okada, Masaya; Ueno, Masaki; Yamamoto, Yoshiyuki; Horita, Masahiro; Suda, Jun

    2016-09-01

    The photocurrent of GaN vertical Schottky barrier diodes was investigated under sub-bandgap wavelength light irradiation. Under a low reverse bias voltage, the photocurrent is induced by internal photoemission, while under a high reverse bias voltage, the photocurrent increases significantly with the bias voltage. This is due to sub-bandgap optical absorption in a depletion region due to the Franz–Keldysh effect. The voltage and wavelength dependences of the photocurrent are successfully explained quantitatively.

  9. CdSe Nanowire-Based Flexible Devices: Schottky Diodes, Metal-Semiconductor Field-Effect Transistors, and Inverters.

    PubMed

    Jin, Weifeng; Zhang, Kun; Gao, Zhiwei; Li, Yanping; Yao, Li; Wang, Yilun; Dai, Lun

    2015-06-24

    Novel CdSe nanowire (NW)-based flexible devices, including Schottky diodes, metal-semiconductor field-effect transistors (MESFETs), and inverters, have been fabricated and investigated. The turn-on voltage of a typical Schottky diode is about 0.7 V, and the rectification ratio is larger than 1 × 10(7). The threshold voltage, on/off current ratio, subthreshold swing, and peak transconductance of a typical MESFET are about -0.3 V, 4 × 10(5), 78 mV/dec, and 2.7 μS, respectively. The inverter, constructed with two MESFETs, exhibits clear inverting behavior with the gain to be about 28, 34, and 38, at the supply voltages (V(DD)) of 3, 5, and 7 V, respectively. The inverter also shows good dynamic behavior. The rising and falling times of the output signals are about 0.18 and 0.09 ms, respectively, under 1000 Hz square wave signals input. The performances of the flexible devices are stable and reliable under different bending conditions. Our work demonstrates these flexible NW-based Schottky diodes, MESFETs, and inverters are promising candidate components for future portable transparent nanoelectronic devices. PMID:26061530

  10. The Study of 0.34 THz Monolithically Integrated Fourth Subharmonic Mixer Using Planar Schottky Barrier Diode

    NASA Astrophysics Data System (ADS)

    Tong, Xiaodong; Li, Qian; An, Ning; Wang, Wenjie; Deng, Xiaodong; Zhang, Liang; Liu, Haitao; Zeng, Jianping; Li, Zhiqiang; Tang, Hailing; Xiong, Yong-Zhong

    2015-11-01

    A planar Schottky barrier diode with the designed Schottky contact area of approximately 3 μm2 is developed on gallium arsenide (GaAs) material. The measurements of the developed planar Schottky barrier diode indicate that the zero-biased junction capacitance Cj0 is 11.0 fF, the parasitic series resistance RS is 3.0 Ω, and the cut off frequency fT is 4.8 THz. A monolithically integrated fourth subharmonic mixer with this diode operating at the radio frequency (RF) signal frequency of 0.34 THz with the chip area of 0.6 mm2 is implemented. The intermediate frequency (IF) bandwidth is from DC to 40 GHz. The local oscillator (LO) bandwidth is 37 GHz from 60 to 97 GHz. The RF bandwidth is determined by the bandwidth of the on chip antenna, which is 28 GHz from 322 to 350 GHz. The measurements of the mixer demonstrated a conversion loss of approximately 51 dB.

  11. Improved performance in vertical GaN Schottky diode assisted by AlGaN tunneling barrier

    NASA Astrophysics Data System (ADS)

    Cao, Y.; Chu, R.; Li, R.; Chen, M.; Williams, A. J.

    2016-03-01

    In a vertical GaN Schottky barrier diode, the free electron concentration n in the 6-μm-thick drift layer was found to greatly impact the diode reverse leakage current, which increased from 2.1 × 10-7 A to 3.9 × 10-4 A as n increased from 7.5 × 1014 cm-3 to 6.3 × 1015 cm-3 at a reverse bias of 100 V. By capping the drift layer with an ultrathin 5-nm graded AlGaN layer, reverse leakage was reduced by more than three orders of magnitude with the same n in the drift layer. We attribute this to the increased Schottky barrier height with the AlGaN at the surface. Meanwhile, the polarization field within the graded AlGaN effectively shortened the depletion depth, which led to the formation of tunneling current at a relatively small forward bias. The turn-on voltage in the vertical Schottky diodes was reduced from 0.77 V to 0.67 V—an advantage in reducing conduction loss in power switching applications.

  12. Effect of reactive ion etch-induced damage on the performance of 4H-SiC schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Khemka, V.; Chow, T. P.; Gutmann, R. J.

    1998-10-01

    The effect of reactive ion etch (RIE) induced damage on 4H-SiC surfaces etched in fluorinated plamas has been investigated and characterized using Ni Schottky diodes and x-ray photoelectron spectroscopic surface analysis. The diodes were characterized using current-voltage, current-voltage-temperature, and capacitance-voltage measurements with near ideal forward characteristics (n=1.07) and forward current density as high as 9000 A/cm2 from the control (unetched) devices. High current handling capability was observed in diodes with etched surfaces as well. Diodes with surfaces etched in CHF3 containing plasmas showed a significant reduction in the barrier height compared to the diodes with surfaces etched in CF4 containing plasma. Control devices exhibited high leakages when reverse biased, which is attributed to the presence of a thin (˜2 nm) oxide layer at the metal-semiconductor interface. However, under reverse bias diodes with CHF3-etched surfaces showed improvement in leakage current compared to diodes with CF4-etched surfaces and the control diodes.

  13. Current transient spectroscopy for trapping analysis on Au-free AlGaN/GaN Schottky barrier diode

    SciTech Connect

    Hu, J. Groeseneken, G.; Stoffels, S.; Lenci, S.; Venegas, R.; Decoutere, S.; Bakeroot, B.

    2015-02-23

    This paper presents a combined technique of high voltage off-state stress and current transient measurements to investigate the trapping/de-trapping characteristics of Au-free AlGaN/GaN Schottky barrier diodes. The device features a symmetric three-terminal structure with a central anode contact surrounded by two separate cathodes. Under the diode off-state stress conditions, the two separate cathodes were electrically shorted. The de-trapping dynamics was studied by monitoring the recovery of the two-dimensional electron gas (2DEG) current at different temperatures by applying 0.5 V at cathode 2 while grounding cathode 1. During the recovery, the anode contact acts as a sensor of changes in diode leakage current. This leakage variation was found to be mainly due to the barrier height variation. With this method, the energy level and capture cross section of different traps in the AlGaN/GaN Schottky barrier diode can be extracted. Furthermore, the physical location of different trapping phenomena is indicated by studying the variation of the diode leakage current during the recovery. We have identified two distinct trapping mechanisms: (i) electron trapping at the AlGaN surface in the vicinity of the Schottky contact which results in the leakage reduction (barrier height ϕ{sub B} increase) together with R{sub ON} degradation; (ii) the electron trapping in the GaN channel layer which partially depletes the 2DEG. The physical origin of the two different traps is discussed in the text.

  14. High-resolution Schottky CdTe diode for hard X-ray and gamma-ray astronomy

    NASA Astrophysics Data System (ADS)

    Takahashi, T.; Paul, B.; Hirose, K.; Matsumoto, C.; Ohno, R.; Ozaki, T.; Mori, K.; Tomita, Y.

    1999-10-01

    We report a significant improvement of the spectral properties of cadmium telluride (CdTe) detectors, fabricated in the form of a Schottky CdTe diode. With the use of high quality CdTe wafer, we formed a Schottky junction by evaporating indium on the Te-face and operated the detector as a diode. This allows us to apply much higher bias voltage than was possible with the previous CdTe detectors. A /2 mm/×2 mm detector of thickness 0.5 mm, when operated at a temperature of /5°C, shows leakage current of only 0.2 and 0.4 nA for an operating voltage of 400 and 800 V, respectively. We found that, at a high-electric field of several kV cm-1, the Schottky CdTe diode has very good energy resolution and stability, suitable for astronomical applications. The broad low-energy tail, often observed in CdTe detectors due to the low mobility and short lifetime of holes, was significantly reduced by the application of a higher bias voltage which improves the charge collection efficiency. We achieved very good FWHM energy resolution of /1.1% and /0.8% at energies 122 and 511 keV, respectively, without any rise time discrimination or pulse height correction electronics. For the detection of hard X-rays and gamma-rays above 100 keV, we have improved the detection efficiency by stacking a number of thin CdTe diodes. Using individual readout electronics for each layer, we obtained high detection efficiency without sacrificing the energy resolution. In this paper, we report the performance of the new CdTe diode and discuss its proposed applications in future hard X-ray and gamma-ray astronomy missions.

  15. Investigation of the Electrical Characteristics of Al/p-Si/Al Schottky Diode

    NASA Astrophysics Data System (ADS)

    Şenarslan, Elvan; Güzeldir, Betül; Sağlam, Mustafa

    2016-04-01

    In this study, p-type Si semiconductor wafer with (100) orientation, 400 μm thickness and 1-10 Ω cm resistivity was used. The Si wafer before making contacts were chemically cleaned with the Si cleaning procedure which for remove organic contaminations were ultrasonically cleaned at acetone and methanol for 10 min respectively and then rinsed in deionized water of 18 MΩ and dried with high purity N2. Then respectively RCA1(i.e., boiling in NH3+H2O2+6H2O for 10 min at 60°C ), RCA2 (i.e., boiling in HCl+H2O2+6H2O for 10 min at 60°C ) cleaning procedures were applied and rinsed in deionized water followed by drying with a stream of N2. After the cleaning process, the wafer is immediately inserted in to the coating unit. Ohmic contact was made by evaporating of Al on the non-polished side of the p-Si wafer pieces under ~ 4,2 10-6 Torr pressure. After process evaporation, p-Si with omic contac thermally annealed 580°C for 3 min in a quartz tube furnace in N2. Then, the rectifier contact is made by evaporation Al metal diameter of about 1.0 mm on the polished surface of p-Si in turbo molecular pump at about ~ 1 10-6 Torr. Consequently, Al/p-Si/Al Schottky diode was obtained. The I–V measurements of this diode performed by the use of a KEITLEY 487 Picoammeter/Voltage Source and the C–V measurements were performed with HP 4192A (50–13 MHz) LF Impedance Analyzer at room temperature and in dark.

  16. Characterization of a synthetic single crystal diamond Schottky diode for radiotherapy electron beam dosimetry

    SciTech Connect

    Di Venanzio, C.; Marinelli, Marco; Milani, E.; Prestopino, G.; Verona, C.; Verona-Rinati, G.; Falco, M. D.; Bagala, P.; Santoni, R.; Pimpinella, M.

    2013-02-15

    Purpose: To investigate the dosimetric properties of synthetic single crystal diamond based Schottky diodes under irradiation with therapeutic electron beams from linear accelerators. Methods: A single crystal diamond detector was fabricated and tested under 6, 8, 10, 12, and 15 MeV electron beams. The detector performances were evaluated using three types of commercial detectors as reference dosimeters: an Advanced Markus plane parallel ionization chamber, a Semiflex cylindrical ionization chamber, and a p-type silicon detector. Preirradiation, linearity with dose, dose rate dependence, output factors, lateral field profiles, and percentage depth dose profiles were investigated and discussed. Results: During preirradiation the diamond detector signal shows a weak decrease within 0.7% with respect to the plateau value and a final signal stability of 0.1% (1{sigma}) is observed after about 5 Gy. A good linear behavior of the detector response as a function of the delivered dose is observed with deviations below {+-}0.3% in the dose range from 0.02 to 10 Gy. In addition, the detector response is dose rate independent, with deviations below 0.3% in the investigated dose rate range from 0.17 to 5.45 Gy/min. Percentage depth dose curves obtained from the diamond detector are in good agreement with the ones from the reference dosimeters. Lateral beam profile measurements show an overall good agreement among detectors, taking into account their respective geometrical features. The spatial resolution of solid state detectors is confirmed to be better than that of ionization chambers, being the one from the diamond detector comparable to that of the silicon diode. A good agreement within experimental uncertainties was also found in terms of output factor measurements between the diamond detector and reference dosimeters. Conclusions: The observed dosimetric properties indicate that the tested diamond detector is a suitable candidate for clinical electron beam dosimetry.

  17. Modification of electrical properties of Au/n-type InP Schottky diode with a high-k Ba0.6Sr0.4TiO3 interlayer

    NASA Astrophysics Data System (ADS)

    Thapaswini, P. Prabhu; Padma, R.; Balaram, N.; Bindu, B.; Rajagopal Reddy, V.

    2016-05-01

    Au/Ba0.6Sr0.4TiO3 (BST)/n-InP metal/insulator/semiconductor (MIS) Schottky diodes have been analyzed by current-voltage (I-V) and capacitance-voltage (C-V) measurements. The surface morphology of the BST films on InP is fairly smooth. The Au/BST/n-InP MIS Schottky diode shows better rectification ratio and low leakage current compared to the conventional Au/n-InP metal-semiconductor (MS) Schottky diode. Higher barrier height is achieved for the MIS Schottky diode compared to the MS Schottky diode. The Norde and Cheung's methods are employed to determine the barrier height, ideality factor and series resistance. The interface state density (NSS) is determined from the forward bias I-V data for both the MS and MIS Schottky diodes. Results reveal that the NSS of the MIS Schottky diode is lower than that of the MS Schottky diode. The Poole-Frenkel emission is found dominating the reverse current in both Au/n-InP MS and Au/BST/n-InP MIS Schottky diodes, indicating the presence of structural defects and trap levels in the dielectric film.

  18. Optimization of chemical structure of Schottky-type selection diode for crossbar resistive memory.

    PubMed

    Kim, Gun Hwan; Lee, Jong Ho; Jeon, Woojin; Song, Seul Ji; Seok, Jun Yeong; Yoon, Jung Ho; Yoon, Kyung Jean; Park, Tae Joo; Hwang, Cheol Seong

    2012-10-24

    The electrical performances of Pt/TiO(2)/Ti/Pt stacked Schottky-type diode (SD) was systematically examined, and this performance is dependent on the chemical structures of the each layer and their interfaces. The Ti layers containing a tolerable amount of oxygen showed metallic electrical conduction characteristics, which was confirmed by sheet resistance measurement with elevating the temperature, transmission line measurement (TLM), and Auger electron spectroscopy (AES) analysis. However, the chemical structure of SD stack and resulting electrical properties were crucially affected by the dissolved oxygen concentration in the Ti layers. The lower oxidation potential of the Ti layer with initially higher oxygen concentration suppressed the oxygen deficiency of the overlying TiO(2) layer induced by consumption of the oxygen from TiO(2) layer. This structure results in the lower reverse current of SDs without significant degradation of forward-state current. Conductive atomic force microscopy (CAFM) analysis showed the current conduction through the local conduction paths in the presented SDs, which guarantees a sufficient forward-current density as a selection device for highly integrated crossbar array resistive memory. PMID:22999222

  19. Measuring the Electronic Properties of DNA-Specific Schottky Diodes Towards Detecting and Identifying Basidiomycetes DNA

    PubMed Central

    Periasamy, Vengadesh; Rizan, Nastaran; Al-Ta’ii, Hassan Maktuff Jaber; Tan, Yee Shin; Tajuddin, Hairul Annuar; Iwamoto, Mitsumasa

    2016-01-01

    The discovery of semiconducting behavior of deoxyribonucleic acid (DNA) has resulted in a large number of literatures in the study of DNA electronics. Sequence-specific electronic response provides a platform towards understanding charge transfer mechanism and therefore the electronic properties of DNA. It is possible to utilize these characteristic properties to identify/detect DNA. In this current work, we demonstrate a novel method of DNA-based identification of basidiomycetes using current-voltage (I-V) profiles obtained from DNA-specific Schottky barrier diodes. Electronic properties such as ideality factor, barrier height, shunt resistance, series resistance, turn-on voltage, knee-voltage, breakdown voltage and breakdown current were calculated and used to quantify the identification process as compared to morphological and molecular characterization techniques. The use of these techniques is necessary in order to study biodiversity, but sometimes it can be misleading and unreliable and is not sufficiently useful for the identification of fungi genera. Many of these methods have failed when it comes to identification of closely related species of certain genus like Pleurotus. Our electronics profiles, both in the negative and positive bias regions were however found to be highly characteristic according to the base-pair sequences. We believe that this simple, low-cost and practical method could be useful towards identifying and detecting DNA in biotechnology and pathology. PMID:27435636

  20. Measuring the Electronic Properties of DNA-Specific Schottky Diodes Towards Detecting and Identifying Basidiomycetes DNA.

    PubMed

    Periasamy, Vengadesh; Rizan, Nastaran; Al-Ta'ii, Hassan Maktuff Jaber; Tan, Yee Shin; Tajuddin, Hairul Annuar; Iwamoto, Mitsumasa

    2016-01-01

    The discovery of semiconducting behavior of deoxyribonucleic acid (DNA) has resulted in a large number of literatures in the study of DNA electronics. Sequence-specific electronic response provides a platform towards understanding charge transfer mechanism and therefore the electronic properties of DNA. It is possible to utilize these characteristic properties to identify/detect DNA. In this current work, we demonstrate a novel method of DNA-based identification of basidiomycetes using current-voltage (I-V) profiles obtained from DNA-specific Schottky barrier diodes. Electronic properties such as ideality factor, barrier height, shunt resistance, series resistance, turn-on voltage, knee-voltage, breakdown voltage and breakdown current were calculated and used to quantify the identification process as compared to morphological and molecular characterization techniques. The use of these techniques is necessary in order to study biodiversity, but sometimes it can be misleading and unreliable and is not sufficiently useful for the identification of fungi genera. Many of these methods have failed when it comes to identification of closely related species of certain genus like Pleurotus. Our electronics profiles, both in the negative and positive bias regions were however found to be highly characteristic according to the base-pair sequences. We believe that this simple, low-cost and practical method could be useful towards identifying and detecting DNA in biotechnology and pathology. PMID:27435636

  1. Measuring the Electronic Properties of DNA-Specific Schottky Diodes Towards Detecting and Identifying Basidiomycetes DNA

    NASA Astrophysics Data System (ADS)

    Periasamy, Vengadesh; Rizan, Nastaran; Al-Ta’Ii, Hassan Maktuff Jaber; Tan, Yee Shin; Tajuddin, Hairul Annuar; Iwamoto, Mitsumasa

    2016-07-01

    The discovery of semiconducting behavior of deoxyribonucleic acid (DNA) has resulted in a large number of literatures in the study of DNA electronics. Sequence-specific electronic response provides a platform towards understanding charge transfer mechanism and therefore the electronic properties of DNA. It is possible to utilize these characteristic properties to identify/detect DNA. In this current work, we demonstrate a novel method of DNA-based identification of basidiomycetes using current-voltage (I-V) profiles obtained from DNA-specific Schottky barrier diodes. Electronic properties such as ideality factor, barrier height, shunt resistance, series resistance, turn-on voltage, knee-voltage, breakdown voltage and breakdown current were calculated and used to quantify the identification process as compared to morphological and molecular characterization techniques. The use of these techniques is necessary in order to study biodiversity, but sometimes it can be misleading and unreliable and is not sufficiently useful for the identification of fungi genera. Many of these methods have failed when it comes to identification of closely related species of certain genus like Pleurotus. Our electronics profiles, both in the negative and positive bias regions were however found to be highly characteristic according to the base-pair sequences. We believe that this simple, low-cost and practical method could be useful towards identifying and detecting DNA in biotechnology and pathology.

  2. Humidity influenced capacitance and resistance of an Al/DNA/Al Schottky diode irradiated by alpha particles.

    PubMed

    Al-Ta'ii, Hassan Maktuff Jaber; Amin, Yusoff Mohd; Periasamy, Vengadesh

    2016-01-01

    Deoxyribonucleic acid or DNA based sensors, especially as humidity and alpha particle sensors have become quite popular in recent times due to flexible and highly optimizable nature of this fundamental biomaterial. Application of DNA electronics allow for more sensitive, accurate and effective sensors to be developed and fabricated. In this work, we examined the effect of different humidity conditions on the capacitive and resistive response of Aluminum (Al)/DNA/Al Schottky barrier structure when bombarded by time-dependent dosages of alpha particles. Based on current-voltage profiles, which demonstrated rectifying behaviours, Schottky diode parameters such as ideality factor, barrier height and series resistance was calculated. Results observed generally pointed towards a decrease in the resistance value from the pristine to the radiated structures. It was also demonstrated that under the effect of humidity, the capacitance of the DNA thin film increased from 0.05894 to 92.736 nF, with rising relative humidity level. We also observed the occurrence of the hypersensitivity phenomena after alpha irradiation between 2 to 4 min by observing a drop in the series resistance, crucial in the study of DNA damage and repair mechanisms. These observations may also suggest the exciting possibility of utilizing Al/DNA/Al Schottky diodes as potentially sensitive humidity sensors. PMID:27160654

  3. Humidity influenced capacitance and resistance of an Al/DNA/Al Schottky diode irradiated by alpha particles

    NASA Astrophysics Data System (ADS)

    Al-Ta’Ii, Hassan Maktuff Jaber; Amin, Yusoff Mohd; Periasamy, Vengadesh

    2016-05-01

    Deoxyribonucleic acid or DNA based sensors, especially as humidity and alpha particle sensors have become quite popular in recent times due to flexible and highly optimizable nature of this fundamental biomaterial. Application of DNA electronics allow for more sensitive, accurate and effective sensors to be developed and fabricated. In this work, we examined the effect of different humidity conditions on the capacitive and resistive response of Aluminum (Al)/DNA/Al Schottky barrier structure when bombarded by time-dependent dosages of alpha particles. Based on current-voltage profiles, which demonstrated rectifying behaviours, Schottky diode parameters such as ideality factor, barrier height and series resistance was calculated. Results observed generally pointed towards a decrease in the resistance value from the pristine to the radiated structures. It was also demonstrated that under the effect of humidity, the capacitance of the DNA thin film increased from 0.05894 to 92.736 nF, with rising relative humidity level. We also observed the occurrence of the hypersensitivity phenomena after alpha irradiation between 2 to 4 min by observing a drop in the series resistance, crucial in the study of DNA damage and repair mechanisms. These observations may also suggest the exciting possibility of utilizing Al/DNA/Al Schottky diodes as potentially sensitive humidity sensors.

  4. High-performance 4H-SiC junction barrier Schottky diodes with double resistive termination extensions

    NASA Astrophysics Data System (ADS)

    Zheng, Liu; Zhang, Feng; Liu, Sheng-Bei; Dong, Lin; Liu, Xing-Fang; Fan, Zhong-Chao; Liu, Bin; Yan, Guo-Guo; Wang, Lei; Zhao, Wan-Shun; Sun, Guo-Sheng; He, Zhi; Yang, Fu-Hua

    2013-09-01

    4H-SiC junction barrier Schottky (JBS) diodes with a high-temperature annealed resistive termination extension (HARTE) are designed, fabricated and characterized in this work. The differential specific on-state resistance of the device is as low as 3.64 mΩ·cm2 with a total active area of 2.46 × 10-3 cm2. Ti is the Schottky contact metal with a Schottky barrier height of 1.08 V and a low onset voltage of 0.7 V. The ideality factor is calculated to be 1.06. Al implantation annealing is performed at 1250°C in Ar, while good reverse characteristics are achieved. The maximum breakdown voltage is 1000 V with a leakage current of 9 × 10-5 A on chip level. These experimental results show good consistence with the simulation results and demonstrate that high-performance 4H-SiC JBS diodes can be obtained based on the double HARTE structure.

  5. Humidity influenced capacitance and resistance of an Al/DNA/Al Schottky diode irradiated by alpha particles

    PubMed Central

    Al-Ta’ii, Hassan Maktuff Jaber; Amin, Yusoff Mohd; Periasamy, Vengadesh

    2016-01-01

    Deoxyribonucleic acid or DNA based sensors, especially as humidity and alpha particle sensors have become quite popular in recent times due to flexible and highly optimizable nature of this fundamental biomaterial. Application of DNA electronics allow for more sensitive, accurate and effective sensors to be developed and fabricated. In this work, we examined the effect of different humidity conditions on the capacitive and resistive response of Aluminum (Al)/DNA/Al Schottky barrier structure when bombarded by time-dependent dosages of alpha particles. Based on current-voltage profiles, which demonstrated rectifying behaviours, Schottky diode parameters such as ideality factor, barrier height and series resistance was calculated. Results observed generally pointed towards a decrease in the resistance value from the pristine to the radiated structures. It was also demonstrated that under the effect of humidity, the capacitance of the DNA thin film increased from 0.05894 to 92.736 nF, with rising relative humidity level. We also observed the occurrence of the hypersensitivity phenomena after alpha irradiation between 2 to 4 min by observing a drop in the series resistance, crucial in the study of DNA damage and repair mechanisms. These observations may also suggest the exciting possibility of utilizing Al/DNA/Al Schottky diodes as potentially sensitive humidity sensors. PMID:27160654

  6. Effects of Surface and Crystalline Defects on Reverse Characteristics of 4H-SiC Junction Barrier Schottky Diodes

    NASA Astrophysics Data System (ADS)

    Katsuno, Takashi; Watanabe, Yukihiko; Fujiwara, Hirokazu; Konishi, Masaki; Yamamoto, Takeo; Endo, Takeshi

    2011-04-01

    To clarify the relationship between the dispersed reverse characteristics of 4H-SiC junction barrier Schottky (JBS) diodes and defects, we investigated the sensitivity of the reverse characteristics to surface and crystalline defects in 4H-SiC epitaxial layers. Strong correlations were obtained between the reverse characteristics of 4H-SiC JBS diodes and surface defects. Micropipes or particles reduced blocking voltage and carrot defects increased leakage current. Furthermore, the leakage current of 4H-SiC JBS diodes depends on the etch pit density of threading dislocations (TDs). Etch pits formed from TDs increased leakage current by about 10-9 A in samples without surface defects. In addition, hexagonal etch pits formed from unusual crystalline defects were observed; they also increased leakage current.

  7. Carrier transport in graphite/Si{sub 3}N{sub 4}-nanobelt/PtIr Schottky barrier diodes

    SciTech Connect

    Bi, Jinghui; Wei, Guodong; Shang, Minghui; Gao, Fengmei; Yang, Weiyou E-mail: weiyouyang@tsinghua.org.cn; Tang, Bin E-mail: weiyouyang@tsinghua.org.cn

    2014-11-10

    Understanding the roles of contacts and interfaces between metals and semiconductors is critically important for exploring nanostructure-based nanodevices. The present study shed some light on the dominated mechanism of size-dependent carrier transfer in the Schottky barrier diodes configured by the Pt-Ir/Si{sub 3}N{sub 4}-nanobelt/graphite (metal-semiconductor-metal (MSM)) sandwiched structure via a conductive atomic force microscopy using nanobelts with various thicknesses. The observed I-V behaviors suggested that the charge transports under the low and high biases were dominated by the reverse-biased Schottky barrier and space-charge-limited current (SCLC), respectively. The intermediate region between the low and high biases presented the transition between the Ohmic and SCLC behaviors, in which the ≡Si and =N dangling bonds acted as the defects within the Si{sub 3}N{sub 4} nanobelt surface are predominant in the charge transfer.

  8. High efficiency single Ag nanowire/p-GaN substrate Schottky junction-based ultraviolet light emitting diodes

    SciTech Connect

    Wu, Y.; Li, X.; Xu, P.; Wang, Y.; Shen, X.; Liu, X.; Yang, Q.; Hasan, T.

    2015-02-02

    We report a high efficiency single Ag nanowire (NW)/p-GaN substrate Schottky junction-based ultraviolet light emitting diode (UV-LED). The device demonstrates deep UV free exciton electroluminescence at 362.5 nm. The dominant emission, detectable at ultralow (<1 μA) forward current, does not exhibit any shifts when the forward current is increased. External quantum efficiency (EQE) as high as 0.9% is achieved at 25 μA current at room temperature. Experiments and simulation analysis show that devices fabricated with thinner Ag NWs have higher EQE. However, for very thin Ag NWs (diameter < 250 nm), this trend breaks down due to heat accumulation in the NWs. Our simple device architecture offers a potentially cost-effective scheme to fabricate high efficiency Schottky junction-based UV-LEDs.

  9. An ultra-thin Schottky diode as a transmission particle detector for biological microbeams

    PubMed Central

    Harken, Andrew; Randers-Pehrson, Gerhard; Attinger, Daniel; Brenner, David J.

    2013-01-01

    We fabricated ultrathin metal-semiconductor Schottky diodes for use as transmission particle detectors in the biological microbeam at Columbia University’s Radiological Research Accelerator Facility (RARAF). The RARAF microbeam can deliver a precise dose of ionizing radiation in cell nuclei with sub-micron precision. To ensure an accurate delivery of charged particles, the facility currently uses a commercial charged-particle detector placed after the sample. We present here a transmission detector that will be placed between the particle accelerator and the biological specimen, allowing the irradiation of samples that would otherwise block radiation from reaching a detector behind the sample. Four detectors were fabricated with co-planar gold and aluminum electrodes thermally evaporated onto etched n-type crystalline silicon substrates, with device thicknesses ranging from 8.5 μm – 13.5 μm. We show coincident detections and pulse-height distributions of charged particles in both the transmission detector and the commercial detector above it. Detections are demonstrated at a range of operating conditions, including incoming particle type, count rate, and beam location on the detectors. The 13.5 μm detector is shown to work best to detect 2.7 MeV protons (H+), and the 8.5 μm detector is shown to work best to detect 5.4 MeV alpha particles (4He++). The development of a transmission detector enables a range of new experiments to take place at RARAF on radiation-stopping samples such as thick tissues, targets that need immersion microscopy, and integrated microfluidic devices for handling larger quantities of cells and small organisms. PMID:24058378

  10. Schottky barrier height of Ni/TiO2/4H-SiC metal-insulator-semiconductor diodes

    NASA Astrophysics Data System (ADS)

    Kaufmann, Ivan R.; Pereira, Marcelo B.; Boudinov, Henri I.

    2015-12-01

    Ni/TiO2/4H-SiC diodes were analysed through measurements of current-voltage curves varying the temperature. The Schottky Barrier Height (SBH) which increased with temperature was studied by simulation of the Thermionic Emission Model, considering Ni/SiC Schottky structures with an insulator layer between the metal and semiconductor. This model shows that a new method of calculation should be applied to diodes that have a metal-insulator-semiconductor structure. Misleading results for SBH are obtained if the thin insulator layer is not considered. When applying the suggested method to the Ni/TiO2/4H-SiC diodes it was necessary to consider not only the deposited TiO2 layer, but also a second dielectric layer of native SiCxOy at the surface of SiC. By measuring I-V-T curves for two samples with different thicknesses of TiO2, the suggested method allows one to estimate the thicknesses of both dielectric layers: TiO2 and SiOxCy.

  11. Comparison of InP Schottky diodes based on Au or Pd sensing electrodes for NO2 and O3 sensing

    NASA Astrophysics Data System (ADS)

    Varenne, C.; Ndiaye, A.; Brunet, J.; Monier, G.; Spinelle, L.; Pauly, A.; Bideux, L.; Lauron, B.; Robert-Goumet, C.

    2012-06-01

    In previous reports, we have investigated on the influence of current transport mechanism on the sensitivity of InP Schottky and pseudo-Schottky diodes, for nitrogen dioxide detection. In this paper, the influence of the metal nature and the structure of the rectifying contact on the sensing layer are highlighted. More especially, we will focus on the behavior of these Schottky structures during and after their exposures to nitrogen dioxide (NO2) and ozone (O3). In this context, two types of structures have been studied: the simple Schottky diodes and the more elaborated structures called pseudo-Schottky. These diodes are realized with Au or Pd as metals. First, we will describe samples preparation and electrical characterization of the two types of structures. Then, we will compare sensor responses of these different structures under NO2 and O3. Finally, to better understand the action of these gases on the sensitive layer (the Schottky contact), X-rays photoelectron spectroscopy (XPS) is performed to follow the evolution of the metallic layer. The poisoning effect of active sites, which appears after NO2 and O3 expositions, is illustrated by comparative study of the active layer before and after exposure.

  12. Dual-Functional On-Chip AlGaAs/GaAs Schottky Diode for RF Power Detection and Low-Power Rectenna Applications

    PubMed Central

    Hashim, Abdul Manaf; Mustafa, Farahiyah; Rahman, Shaharin Fadzli Abd; Rahman, Abdul Rahim Abdul

    2011-01-01

    A Schottky diode has been designed and fabricated on an n-AlGaAs/GaAs high-electron-mobility-transistor (HEMT) structure. Current-voltage (I–V) measurements show good device rectification, with a Schottky barrier height of 0.4349 eV for Ni/Au metallization. The differences between the Schottky barrier height and the theoretical value (1.443 eV) are due to the fabrication process and smaller contact area. The RF signals up to 1 GHz are rectified well by the fabricated Schottky diode and a stable DC output voltage is obtained. The increment ratio of output voltage vs input power is 0.2 V/dBm for all tested frequencies, which is considered good enough for RF power detection. Power conversion efficiency up to 50% is obtained at frequency of 1 GHz and input power of 20 dBm with series connection between diode and load, which also shows the device’s good potential as a rectenna device with further improvement. The fabricated n-AlGaAs/GaAs Schottky diode thus provides a conduit for breakthrough designs for RF power detectors, as well as ultra-low power on-chip rectenna device technology to be integrated in nanosystems. PMID:22164066

  13. Ultraviolet electroluminescence from Au-ZnO nanowire Schottky type light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Gao, Fan; Zhang, Dakuan; Wang, Jianyu; Sun, Huabin; Yin, Yao; Sheng, Yun; Yan, Shancheng; Yan, Bo; Sui, Chenghua; Zheng, Youdou; Shi, Yi; Liu, Jianlin

    2016-06-01

    Ultraviolet electroluminescence from Schottky type LED device is demonstrated. The device prototype is based on Schottky junctions formed between Au and the top ends of ZnO nanowire arrays. Rectifying current-voltage characteristics are observed, and three different charge transport mechanisms are discussed in detail. Excitonic electroluminescence at around 380 nm is detected at high forward bias and the linear relationship between intensity and current suggests a LED device performance. The observation of LED signals from the simple Schottky structure provides a potential supplement to the category of ultraviolet LED devices.

  14. Studying of barrier height and ideality factor relation in the nano sized Au-n type Si Schottky diodes

    NASA Astrophysics Data System (ADS)

    Yeganeh, M. A.; Mamedov, R. K.; Rahmatallahpur, Sh.

    2011-07-01

    The results of formation of the operating potential barrier height ( Φв) of inhomogeneous Schottky diodes (SD) in view of an additional electric field in the near contact region of the semiconductor and features of its dependence on the external applied voltage are presented. A correlation, between SD heterogeneity and dependence between potential barrier height ( Φв) and ideality factor ( n), is presented. Using conducting probe atomic force microscope (CP-AFM) techniques, it is shown that Au/n-Si diodes consist of sets of parallel-connected and cooperating nano diodes with the contact surfaces sizes in the order of 100-200 nm. The effective Φв and ideality factors of the SD have been obtained from the current-voltage ( I- V) characteristics, which were measured using a CP-AFM along a contact surface. It was experimentally shown that the forward and reverse part of I- V characteristics and their effective Φв and ideality factors of the identically fabricated nano-SD differ from diode to diode. The Φв for the nano-SD has ranged from 0.565 to 0.723 eV and ideality factor from 1.11 to 1.98. No correlation can be found between the Φв and ideality factor. The Φв distribution obtained from the I- V characteristics has been fitted by a Gaussian function but the ideality factor distribution could not be fitted by a Gaussian function.

  15. Magnetic field induced suppression of the forward bias current in Bi2Se3/Si Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Jin, Haoming; Hebard, Arthur

    Schottky diodes formed by van der Waals bonding between freshly cleaved flakes of the topological insulator Bi2Se3 and doped silicon substrates show electrical characteristics in good agreement with thermionic emission theory. The motivation is to use magnetic fields to modulate the conductance of the topologically protected conducting surface state. This surface state in close proximity to the semiconductor surface may play an important role in determining the nature of the Schottky barrier. Current-voltage (I-V) and capacitance-voltage (C-V) characteristics were obtained for temperatures in the range 50-300 K and magnetic fields, both perpendicular and parallel to the interface, as high as 7 T. The I-V curve shows more than 6 decades linearity on semi-logarithmic plots, allowing extraction of parameters such as ideality (η), zero-voltage Schottky barrier height (SBH), and series resistance (Rs). In forward bias we observe a field-induced decrease in current which becomes increasingly more pronounced at higher voltages and lower temperature, and is found to be correlated with changes in Rs rather than other barrier parameters. A comparison of changes in Rs in both field direction will be made with magnetoresistance in Bi2Se3 transport measurement. The work is supported by NSF through DMR 1305783.

  16. InGaAs Schottky barrier diode array detector for a real-time compact terahertz line scanner.

    PubMed

    Han, Sang-Pil; Ko, Hyunsung; Park, Jeong-Woo; Kim, Namje; Yoon, Young-Jong; Shin, Jun-Hwan; Kim, Dae Yong; Lee, Dong Hun; Park, Kyung Hyun

    2013-11-01

    We present a terahertz (THz) broadband antenna-integrated 1 × 20 InGaAs Schottky barrier diode (SBD) array detector with an average responsivity of 98.5 V/W at a frequency of 250 GHz, which is measured without attaching external amplifiers and Si lenses, and an average noise equivalent power (NEP) of 106.6 pW/√Hz. The 3-dB bandwidth of the SBD detector is also investigated at approximately 180 GHz. For implementing an array-type SBD detector by a simple fabrication process to achieve a high yield, a structure comprising an SiN(x) layer instead of an air bridge between the anode and the cathode is designed. THz line beam imaging using a Gunn diode emitter with a center frequency of 250 GHz and a 1 × 20 SBD array detector is successfully demonstrated. PMID:24216813

  17. The effects of illumination on electrical parameters of Au/P3HT/n-Si Schottky barrier diode

    NASA Astrophysics Data System (ADS)

    Yükseltürk, Esra; Bülbül, M. Mahir; Zeyrek, Sedat

    2016-03-01

    The electrical characteristics of Au/P3HT/n-Si Schottky Barrier Diode (SBD) have been investigated by using current-voltage (I-V), capacitance-voltage (C-V) and conductance-voltage (G/ω-V) measurements at room temperature and 1MHz. The illumination effects on main structure parameters such as zero-bias-barrier height (ΦBo), ideality factor (n), series resistance (Rs) and interface states (Nss) of Au/P3HT/n-Si diode were determined in dark and under various illumination intensities. Under illumination, both of the values of forward and reverse currents have increased with increasing illumination intensity. The density of interface states (Nss) distribution profiles as a function of (Ec-Ess) was extracted from the forward I-V measurements dark and under various illumination intensities. The interface state densities were observed to be strongly illumination dependent and are decreased with increasing illumination intensities.

  18. Influence of temperature on Al/p-CuInAlSe2 thin-film Schottky diodes

    NASA Astrophysics Data System (ADS)

    Parihar, Usha; Ray, Jaymin; Panchal, C. J.; Padha, Naresh

    2016-06-01

    Al/p-CuInAlSe2 Schottky diodes were fabricated using the optimized thin layers of CuInAlSe2 semiconductor. These diodes were used to study their temperature-dependent current-voltage (I-V) and capacitance-voltage (C-V) analysis over a wide range of 233-353 K. Based on these measurements, diode parameters such as ideality factor ( η), barrier height (ϕbo) and series resistance ( R s) were determined from the downward curvature of I-V characteristics using Cheung and Cheung method. The extracted parameters were found to be strongly temperature dependent; ϕbo increases, while η and R s decrease with increasing temperature. This behavior of ϕbo and η with change in temperature has been explained on the basis of barrier inhomogeneities over the MS interface by assuming a Gaussian distribution (GD) of the ϕbo at the interface. GD of barrier height (BH) was confirmed from apparent BH (ϕap) versus q/2 kT plot, and the values of the mean BH and standard deviation (σs) obtained from this plot at zero bias were found to be 1.02 and 0.14 eV, respectively. Also, a modified ln ( {J_{{s}} /T2 } ) - q2 σ_{{s}}2 /2k2 T2 versus q/ kT plot for Al/p-CuInAlSe2 Schottky diodes according to the GD gives ϕbo and Richardson constant ( A ** ) as 1.01 eV and 26 Acm-2 K-2, respectively. The Richardson constant value of 26 Acm-2 K-2 is very close to the theoretical value of 30 Acm-2 K-2. The discrepancy between BHs obtained from I-V and C-V measurements has also been interpreted.

  19. Schottky diodes between Bi{sub 2}S{sub 3} nanorods and metal nanoparticles in a polymer matrix as hybrid bulk-heterojunction solar cells

    SciTech Connect

    Saha, Sudip K.; Pal, Amlan J.

    2015-07-07

    We report the use of metal-semiconductor Schottky junctions in a conjugated polymer matrix as solar cells. The Schottky diodes, which were formed between Bi{sub 2}S{sub 3} nanorods and gold nanoparticles, efficiently dissociated photogenerated excitons. The bulk-heterojunction (BHJ) devices based on such metal-semiconductor Schottky diodes in a polymer matrix therefore acted as an efficient solar cell as compared to the devices based on only the semiconductor nanorods in the polymer matrix or when gold nanoparticles were added separately to the BHJs. In the latter device, gold nanoparticles offered plasmonic enhancement due to an increased cross-section of optical absorption. We report growth and characteristics of the Schottky junctions formed through an intimate contact between Bi{sub 2}S{sub 3} nanorods and gold nanoparticles. We also report fabrication and characterization of BHJ solar cells based on such heterojunctions. We highlight the benefit of using metal-semiconductor Schottky diodes over only inorganic semiconductor nanorods or quantum dots in a polymer matrix in forming hybrid BHJ solar cells.

  20. Schottky diodes between Bi2S3 nanorods and metal nanoparticles in a polymer matrix as hybrid bulk-heterojunction solar cells

    NASA Astrophysics Data System (ADS)

    Saha, Sudip K.; Pal, Amlan J.

    2015-07-01

    We report the use of metal-semiconductor Schottky junctions in a conjugated polymer matrix as solar cells. The Schottky diodes, which were formed between Bi2S3 nanorods and gold nanoparticles, efficiently dissociated photogenerated excitons. The bulk-heterojunction (BHJ) devices based on such metal-semiconductor Schottky diodes in a polymer matrix therefore acted as an efficient solar cell as compared to the devices based on only the semiconductor nanorods in the polymer matrix or when gold nanoparticles were added separately to the BHJs. In the latter device, gold nanoparticles offered plasmonic enhancement due to an increased cross-section of optical absorption. We report growth and characteristics of the Schottky junctions formed through an intimate contact between Bi2S3 nanorods and gold nanoparticles. We also report fabrication and characterization of BHJ solar cells based on such heterojunctions. We highlight the benefit of using metal-semiconductor Schottky diodes over only inorganic semiconductor nanorods or quantum dots in a polymer matrix in forming hybrid BHJ solar cells.

  1. Study of barrier inhomogeneities using I-V-T characteristics of Mo/4H-SiC Schottky diode

    NASA Astrophysics Data System (ADS)

    Ouennoughi, Z.; Toumi, S.; Weiss, R.

    2015-01-01

    In the present work we investigate the forward current-voltage (I-V) characteristics, over a wide temperature range 298-498 K, of Mo/4H-SiC Schottky diode for which aluminum ion implantation was used to create the high resistivity layer forming the guard ring. The (I-V) analysis based on Thermionic Emission (TE) theory shows a decrease of the barrier height ϕB and an increase of the ideality factor n when the temperature decreases. These anomalies are mainly due to the barrier height inhomogeneities at the metal/semiconductor interface as we get a Gaussian distribution of the barrier heights when we plot the apparent barrier height ϕap versus q/2kT. The mean barrier height and the standard deviation obtained values are ϕbarB0=1.160 eV and σ0=88.049 mV, respectively. However, by means of the modified Richardson plot Ln (Is /T2) - (q2 σ 0 2 / 2k2T2) versus q/kT, the mean barrier height and the Richardson constant values obtained are ϕbarB0=1.139 eV and A*=129.425 A/cm2 K2, respectively. The latter value of ϕbarB0 matches very well with the mean barrier height obtained from the plot of ϕap versus q/2kT. The Richardson constant is much closer to the theoretical value of 146 A/cm2 K2. The series resistance Rs is also estimated from the forward current-voltage characteristics of Mo/4H-SiC Schottky contact. This parameter shows strong temperature dependence. The T0 effect is validated for the 298-498 K temperature range for the used Schottky diode and provides a clear evidence for the barrier inhomogeneity at the Mo/4H-SiC interface. Finally, we note the impact of the implantation process as well as the choice of the used ion on the characterized parameters of the Schottky contact.

  2. Effects of Annealing on Electrical Characteristics and Current Transport Mechanisms of the Y/ p-GaN Schottky Diode

    NASA Astrophysics Data System (ADS)

    Reddy, V. Rajagopal; Asha, B.; Choi, Chel-Jong

    2016-07-01

    This study investigates the effects of annealing on the electrical properties and current transport mechanism of Y/ p-GaN Schottky barrier diodes (SBDs). We found no significant change in the surface morphology of the Y Schottky contacts during the annealing process. The Schottky barrier height (SBH) of the as-deposited Y/ p-GaN SBD was estimated to be 0.95 eV ( I- V)/1.19 eV ( C- V). The SBH increased upon annealing at 400°C and 500°C, and then decreased slightly with annealing at 600°C. Thus the maximum SBH of the Y/ p-GaN SBD was achieved at 500°C, with values of 1.01 eV ( I- V)/1.29 eV ( C- V). In addition, the SBH values were estimated by Cheung's, Norde, and Ψs- V plots and were found to be in good agreement with one another. Series resistance ( R S) values were also calculated by I- V, Cheung's, and Norde functions at different annealing temperatures, with results showing a decrease in the interface state density of the SBD with annealing at 500°C, followed by a slight increase upon annealing at 600°C. The forward-bias current transport mechanism of SBD was investigated by the log I-log V plot at different annealing temperatures. Our investigations revealed that the Poole-Frenkel emission mechanism dominated the reverse leakage current in Y/ p-GaN SBD at all annealing temperatures.

  3. Surface and Interface Properties of PdCr/SiC Schottky Diode Gas Sensor Annealed at 425 C

    NASA Technical Reports Server (NTRS)

    Chen, Liang-Yu; Hunter, Gary W.; Neudeck, Philip G.; Knight, Dak

    1998-01-01

    The surface and interface properties of Pd(0.9,)Cr(0.1)/SiC Schottky diode gas sensors both before and after annealing are investigated using Auger electron spectroscopy (AES), scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS). At room temperature the alloy reacted with SiC and formed Pd,Si only in a very narrow interfacial region. After annealing for 250 h ,It 425 C, the surface of the Schottky contact area his much less silicon and carbon contamination than that found on the surface of an annealed Pd/SiC structure. Palladium silicides (Pd(x)Si) formed at a broadened interface after annealing, but a significant layer of alloy film is still free of silicon and carbon. The chromium concentration with respect to palladium is quite uniform down to the deep interface region. A stable catalytic surface and a clean layer of Pd(0.9)Cr(0.1) film are likely responsible for significantly improved device sensitivity.

  4. Surface and Interface Study of PdCr/SiC Schottky Diode Gas Sensor Annealed at 425 C

    NASA Technical Reports Server (NTRS)

    Chen, Liang-Yu; Hunter, Gary W.; Neudeck, Philip G.; Knight, Dak

    1998-01-01

    The surface and interface properties of Pd(sub 0.9)Cr(sub 0.1/SiC Schottky diode gas sensor both before and after annealing are investigated using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy (SEM), and Energy Dispersive Spectroscopy (EDS). At room temperature the alloy reacted with SiC and formed Pd(sub x)Si only in a very narrow interfacial region. After annealing for 250 hours at 425 deg. C, the surface of the Schottky contact area has much less silicon and carbon contamination than that found on the surface of an annealed Pd/SiC structure. Pd(sub x)Si formed at a broadened interface after annealing, but a significant layer of alloy film is still free of silicon and carbon. The chromium concentration with respect to palladium is quite uniform down to the deep interface region. A stable catalytic surface and a clean layer of Pd(sub 0.9)Cr(sub 0.1) film are likely responsible for significantly improved device sensitivity.

  5. Surface and Interface Properties of PdCr/SiC Schottky Diode Gas Sensor Annealed at 425 C

    NASA Technical Reports Server (NTRS)

    Chen, Liang-Yu; Hunter, Gary W.; Neudeck, Philip G.; Knight, Dak

    1998-01-01

    The surface and interface properties of Pd(0.9)Cr(0.1)/SiC Schottky diode gas sensors both before and after annealing are investigated using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy (SEM), and Energy Dispersive Spectroscopy (EDS). At room temperature the alloy reacted with SiC and formed Pd(x)Si only in a very narrow interfacial region. After annealing for 250 hours at 425 C, the surface of the Schottky contact area has much less silicon and carbon contamination than that found on the surface of an annealed Pd/SiC structure. Palladium silicides (Pd(x)Si) formed at a broadened interface after annealing, but a significant layer of alloy film is still free of silicon and carbon. The chromium concentration with respect to palladium is quite uniform down to the deep interface region. A stable catalytic surface and a clean layer of Pd(0.9)Cr(0.1) film are likely responsible for significantly improved device sensitivity.

  6. Deep-level transient spectroscopy on an amorphous InGaZnO{sub 4} Schottky diode

    SciTech Connect

    Chasin, Adrian Bhoolokam, Ajay; Nag, Manoj; Genoe, Jan; Heremans, Paul; Simoen, Eddy; Gielen, Georges

    2014-02-24

    The first direct measurement is reported of the bulk density of deep states in amorphous IGZO (indium-gallium-zinc oxide) semiconductor by means of deep-level transient spectroscopy (DLTS). The device under test is a Schottky diode of amorphous IGZO semiconductor on a palladium (Pd) Schottky-barrier electrode and with a molybdenum (Mo) Ohmic contact at the top. The DLTS technique allows to independently measure the energy and spatial distribution of subgap states in the IGZO thin film. The subgap trap concentration has a double exponential distribution as a function energy, with a value of ∼10{sup 19} cm{sup −3} eV{sup −1} at the conduction band edge and a value of ∼10{sup 17} cm{sup −3} eV{sup −1} at an energy of 0.55 eV below the conduction band. Such spectral distribution, however, is not uniform through the semiconductor film. The spatial distribution of subgap states correlates well with the background doping density distribution in the semiconductor, which increases towards the Ohmic Mo contact, suggesting that these two properties share the same physical origin.

  7. ON-state characteristics of proton irradiated 4H-SiC Schottky diode: The calibration of model parameters for device simulation

    NASA Astrophysics Data System (ADS)

    Vobecký, J.; Hazdra, P.; Záhlava, V.; Mihaila, A.; Berthou, M.

    2014-04-01

    4H silicon carbide Schottky diodes were irradiated by 550 keV protons with the aim to place the ion range into the low-doped n-type epitaxial layer. The diodes were characterized using DLTS, C-V profiling and forward I-V curves. Calibration procedure of model parameters for device simulation has been carried out. It is based on modeling the doping compensation of the n-type epitaxial layer caused by the deep acceptor levels resulting from radiation damage. It is shown that the agreement of simulated and measured forward I-V curves of proton irradiated diodes can be achieved, if the profiles of deep levels are calibrated with respect to irradiation dose, the degradation of electron mobility due to charged deep levels is accounted of and the Schottky barrier height is properly adjusted. The proposed methodology introduces a starting point for exact calibration of ion irradiated SiC unipolar devices.

  8. CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES: Analytical model for reverse characteristics of 4H-SiC merged PN-Schottky (MPS) diodes

    NASA Astrophysics Data System (ADS)

    Song, Qing-Wen; Zhang, Yu-Ming; Zhang, Yi-Men; Lü, Hong-Liang; Chen, Feng-Ping; Zheng, Qing-Li

    2009-12-01

    A new analytical model for reverse characteristics of 4H-SiC merged PN-Schottky diodes (MPS or JBS) is developed. To accurately calculate the reverse characteristics of the 4H-SiC MPS diode, the relationship between the electric field at the Schottky contact and the reverse bias is analytically established by solving the cylindrical Poisson equation after the channel has pinched off. The reverse current density calculated from the Wentzel-Kramers-Brillouin (WKB) theory is verified by comparing it with the experimental result, showing that they are in good agreement with each other. Moreover, the effects of P-region spacing (S) and P-junction depth (Xj) on the characteristics of 4H-SiC MPS are analysed, and are particularly useful for optimizing the design of the high voltage MPS diodes.

  9. 1.9 kV AlGaN/GaN Lateral Schottky Barrier Diodes on Silicon

    SciTech Connect

    Zhu, Mingda; Song, Bo; Qi, Meng; Hu, Zongyang; Nomoto, Kazuki; Yan, Xiaodong; Cao, Yu; Johnson, Wayne; Kohn, Erhard; Jena, Debdeep; Xing, Grace Huili

    2015-02-16

    In this letter, we present AlGaN/GaN lateral Schottky barrier diodes on silicon with recessed anodes and dual field plates. A low specific on-resistance RON,SP (5.12 mΩ · cm2), a low turn-on voltage (<0.7 V) and a high reverse breakdown voltage BV (>1.9 kV), were simultaneously achieved in devices with a 25 μm anode/cathode separation, resulting in a power figure-of-merit (FOM) BV2/RON,SP of 727 MW·cm2. The record high breakdown voltage of 1.9 kV is attributed to the dual field plate structure.

  10. Current transport mechanisms in lattice-matched Pt/Au-InAlN/GaN Schottky diodes

    SciTech Connect

    Ren, Jian; Yan, Dawei Yang, Guofeng; Wang, Fuxue; Xiao, Shaoqing; Gu, Xiaofeng

    2015-04-21

    Lattice-matched Pt/Au-In{sub 0.17}Al{sub 0.83}N/GaN hetreojunction Schottky diodes with circular planar structure have been fabricated and investigated by temperature dependent electrical measurements. The forward and reverse current transport mechanisms are analyzed by fitting the experimental current-voltage characteristics of the devices with various models. The results show that (1) the forward-low-bias current is mainly due to the multiple trap-assisted tunneling, while the forward-high-bias current is governed by the thermionic emission mechanism with a significant series resistance effect; (2) the reverse leakage current under low electric fields (<6 MV/cm) is mainly carried by the Frenkel-Poole emission electrons, while at higher fields the Fowler-Nordheim tunneling mechanism dominates due to the formation of a triangular barrier.

  11. 1.9 kV AlGaN/GaN Lateral Schottky Barrier Diodes on Silicon

    DOE PAGESBeta

    Zhu, Mingda; Song, Bo; Qi, Meng; Hu, Zongyang; Nomoto, Kazuki; Yan, Xiaodong; Cao, Yu; Johnson, Wayne; Kohn, Erhard; Jena, Debdeep; et al

    2015-02-16

    In this letter, we present AlGaN/GaN lateral Schottky barrier diodes on silicon with recessed anodes and dual field plates. A low specific on-resistance RON,SP (5.12 mΩ · cm2), a low turn-on voltage (<0.7 V) and a high reverse breakdown voltage BV (>1.9 kV), were simultaneously achieved in devices with a 25 μm anode/cathode separation, resulting in a power figure-of-merit (FOM) BV2/RON,SP of 727 MW·cm2. The record high breakdown voltage of 1.9 kV is attributed to the dual field plate structure.

  12. Temperature dependent performance of Al/ZnCdS Schottky diode and charge transport analysis

    NASA Astrophysics Data System (ADS)

    Das, Mrinmay; Datta, Joydeep; Dey, Arka; Jana, Rajkumar; Ray, Partha Pratim

    2016-05-01

    Here we report the temperature dependent behaviour of Al/ZnCdS interface. In this regard, ZnCdS nanocomposite was synthesized by hydrothermal technique. Detailed study of schottky parameters including rectification ratio, ideality factor, series resistance and barrier height was performed. We explored the underlying charge transport phenomena through the Metal-semiconductor (MS) interface with the help of space charge limited current(SCLC) theory. A compartive analysis of carrier mobility and diffusion length was done.

  13. Temperature dependent electrical characterisation of Pt/HfO{sub 2}/n-GaN metal-insulator-semiconductor (MIS) Schottky diodes

    SciTech Connect

    Shetty, Arjun Vinoy, K. J.; Roul, Basanta; Mukundan, Shruti; Mohan, Lokesh; Chandan, Greeshma; Krupanidhi, S. B.

    2015-09-15

    This paper reports an improvement in Pt/n-GaN metal-semiconductor (MS) Schottky diode characteristics by the introduction of a layer of HfO{sub 2} (5 nm) between the metal and semiconductor interface. The resulting Pt/HfO{sub 2}/n-GaN metal-insulator-semiconductor (MIS) Schottky diode showed an increase in rectification ratio from 35.9 to 98.9(@ 2V), increase in barrier height (0.52 eV to 0.63eV) and a reduction in ideality factor (2.1 to 1.3) as compared to the MS Schottky. Epitaxial n-type GaN films of thickness 300nm were grown using plasma assisted molecular beam epitaxy (PAMBE). The crystalline and optical qualities of the films were confirmed using high resolution X-ray diffraction and photoluminescence measurements. Metal-semiconductor (Pt/n-GaN) and metal-insulator-semiconductor (Pt/HfO{sub 2}/n-GaN) Schottky diodes were fabricated. To gain further understanding of the Pt/HfO{sub 2}/GaN interface, I-V characterisation was carried out on the MIS Schottky diode over a temperature range of 150 K to 370 K. The barrier height was found to increase (0.3 eV to 0.79 eV) and the ideality factor decreased (3.6 to 1.2) with increase in temperature from 150 K to 370 K. This temperature dependence was attributed to the inhomogeneous nature of the contact and the explanation was validated by fitting the experimental data into a Gaussian distribution of barrier heights.

  14. Design and characterisations of double-channel GaAs pHEMT Schottky diodes based on vertically stacked MMICs for a receiver protection limiter

    NASA Astrophysics Data System (ADS)

    Haris, Norshakila; Kyabaggu, Peter B. K.; Rezazadeh, Ali A.

    2016-07-01

    A microwave receiver protection limiter circuit has been designed, fabricated and tested using vertically stacked GaAs MMIC technology. The limiter circuit with a dimension of 2.5 × 1.3 mm2 is formed by using double-channel AlGaAs/InGaAs pseudomorphic HEMT (pHEMT) Schottky diodes integrated with a low-loss V-shaped coplanar waveguide multilayer structure. The electrical parameter characteristics of the pHEMT Schottky diodes are presented including the C–V profile showing the presence of a double channel in the device layer structure. This unique feature can also be seen from the double-peak responses of the electron density as a function of the device layer width, which represent the high electron concentration at two different 2-DEG layers of the structure. An equivalent circuit model of pHEMT Schottky diodes is demonstrated showing good agreement with the measurement results. At zero-bias condition, the devices show high performance in diode detector applications with voltage sensitivities of more than 89 mV μW‑1 at 10 GHz and at least 5.4 mV μW‑1 at 35 GHz. The measurement results of the limiter circuit demonstrated the blocking of input power signals greater than 20 dBm input power at 3 GHz. To the best of our knowledge this is the first demonstration of the use of pHEMT Schottky diodes in microwave power limiter applications.

  15. Probing Hot Electron Flow Generated on Pt Nanoparticles with Au/TiO2 Schottky Diodes during Catalytic CO Oxidation

    SciTech Connect

    Park, Jeong Y.; Lee, Hyunjoo; Renzas, J. Russell; Zhang, Yawen; Somorjai, G.A.

    2008-05-01

    Hot electron flow generated on colloid platinum nanoparticles during exothermic catalytic carbon monoxide oxidation was directly detected with Au/TiO{sub 2} diodes. Although Au/TiO{sub 2} diodes are not catalytically active, platinum nanoparticles on Au/TiO{sub 2} exhibit both chemicurrent and catalytic turnover rate. Hot electrons are generated on the surface of the metal nanoparticles and go over the Schottky energy barrier between Au and TiO{sub 2}. The continuous Au layer ensures that the metal nanoparticles are electrically connected to the device. The overall thickness of the metal assembly (nanoparticles and Au thin film) is comparable to the mean free path of hot electrons, resulting in ballistic transport through the metal. The chemicurrent and chemical reactivity of nanoparticles with citrate, hexadecylamine, hexadecylthiol, and TTAB (Tetradecyltrimethylammonium Bromide) capping agents were measured during catalytic CO oxidation at pressures of 100 Torr O{sub 2} and 40 Torr CO at 373-513 K. We found that chemicurrent yield varies with each capping agent, but always decreases with increasing temperature. We suggest that this inverse temperature dependence is associated with the influence of charging effects due to the organic capping layer during hot electron transport through the metal-oxide interface.

  16. Anomalous capacitance in temperature and frequency characteristics of a TiW/p-InP Schottky barrier diode

    NASA Astrophysics Data System (ADS)

    Wang, Qingsong; Chen, Jun; Tang, Hengjing; Li, Xue

    2016-06-01

    The capacitance-voltage (C–V) and conductance voltage (G/ω–V) characteristics of a TiW/p-InP Schottky barrier diode (SBD) are measured at 310 K in the frequency range from 10 kHz to 1 MHz and the temperature dependency of the diode from 310 K to 400 K at 1 MHz are also investigated. Anomalous peaks and negative capacitances caused by interface states (N ss ) and series resistance (R s) are discussed, which strongly influence the electrical characteristics of SBD. R s is calculated from the measured capacitance (C m ) and conductance (G m ) values, indicating that the effects of R s are apparent at low frequency. The corrected capacitance (C c) and corrected conductance (G c) are both obtained from the C m and G m values by taking into account R s. The experimental results clearly show that the capacitance (C) and conductance (G) values are strongly dependent on the temperature and frequency.

  17. Radiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeam

    NASA Astrophysics Data System (ADS)

    Pastuović, Željko; Capan, Ivana; Cohen, David D.; Forneris, Jacopo; Iwamoto, Naoya; Ohshima, Takeshi; Siegele, Rainer; Hoshino, Norihiro; Tsuchida, Hidekazu

    2015-04-01

    We studied the radiation hardness of 4H-SiC Schottky barrier diodes (SBD) for the light ion detection and spectroscopy in harsh radiation environments. n-Type SBD prepared on nitrogen-doped (∼4 × 1014 cm-3) epitaxial grown 4H-SiC thin wafers have been irradiated by a raster scanning alpha particle microbeam (2 and 4 MeV He2+ ions separately) in order to create patterned damage structures at different depths within a sensitive volume of tested diodes. Deep Level Transient Spectroscopy (DLTS) analysis revealed the formation of two deep electron traps in the irradiated and not thermally treated 4H-SiC within the ion implantation range (E1 and E2). The E2 state resembles the well-known Z1/2 center, while the E1 state could not be assigned to any particular defect reported in the literature. Ion Beam Induced Charge (IBIC) microscopy with multiple He ion probe microbeams (1-6 MeV) having different penetration depths in tested partly damaged 4H-SiC SBD has been used to determine the degradation of the charge collection efficiency (CCE) over a wide fluence range of damaging alpha particle. A non-linear behavior of the CCE decrease and a significant degradation of the spectroscopic performance with increasing He ion fluence were observed above the value of 1011 cm-2.

  18. Electrical parameters and series resistance analysis of Au/Y/p-InP/Pt Schottky barrier diode at room temperature

    NASA Astrophysics Data System (ADS)

    Rao, L. Dasaradha; Reddy, V. Rajagopal

    2016-05-01

    The current-voltage (I-V) characteristics of Au/Y/p-InP/Pt Schottky barrier diode (SBD) are analyzed at room temperature. The Au/Y/p-InP/Pt SBD shows a good rectification behavior. The ideality factor (n), barrier height (Φb), series resistance (Rs) and shunt resistance (Rsh) are determined from the I-V measurements. The n and Φb values of Au/Y/p-InP/Pt SBD are found to be 1.32 and 0.62 eV respectively. The value of barrier height (BH) obtained from Norde function is compared with those calculated from Cheung's functions. The series resistance (Rs) is calculated from Cheung's and modified Norde functions. Additionally, it is found that n, Φb, Rs, and Rsh have strong correlation with the applied bias. Furthermore, at low and high voltage regions, ohmic and space-charge-limited conduction mechanisms are found to govern the current flow in the diode.

  19. Schottky Diode Applications of the Fast Green FCF Organic Material and the Analyze of Solar Cell Characteristics

    NASA Astrophysics Data System (ADS)

    Çaldiran, Z.; Aydoğan, Ş.; İncekara, Ü.

    2016-05-01

    In this study, a device applications of organic material Fast Green FCF (C37H34N2Na2O10S3Na2) has been investigated. After chemical cleaning process of boron doped H-Si crystals, Al metal was coated on the one surface of crystals by thermal evaporation and fast green organic materials were coated on other surface of crystals with spin coating method (coating parameters; 800 rpm for 60 s). Finally, Ni metal was coated on Fast Green by sputtering and we obtained the Ni/Fast Green FCF/n-Si/Al Schottky type diode. And then we calculated the basic diode parameters of device with current-voltage (I-V) and capacitance- voltage (C-V) measurements at the room temperature. We calculated the ideality factory (n), barrier height (Φb) of rectifing contact from I-V measurements using thermionic emission methods. Furthermore, we calculated ideality factory (n), barrier height (Φb) and series resistance (Rs) of device using Cheung and Norde functions too. The diffusion potential, barrier height, Fermi energy level and donor concentration have been determined from the linear 1/C2-V curves at reverse bias, at room temperature and various frequencies. Besides we measured the current-voltage (I-V) at under light and analyzed the characteristics of the solar cell device.

  20. Diameter-dependent electronic transport properties of Au-catalyst/Ge-nanowire Schottky diodes

    SciTech Connect

    Picraux, S Thomas; Leonard, Francois; Swartzentruber, Brian S; Talin, A Alee

    2008-01-01

    We present electronic transport measurements in individual Au-catalyst/Ge-nanowire interfaces demonstrating the presence of a Schottky barrier. Surprisingly, the small-bias conductance density increases with decreasing diameter. Theoretical calculations suggest that this effect arises because electron-hole recombination in the depletion region is the dominant charge transport mechanism, with a diameter dependence of both the depletion width and the electron-hole recombination time. The recombination time is dominated by surface contributions and depends linearly on the nanowire diameter.

  1. Displacement Damage Induced Catastrophic Second Breakdown in Silicon Carbide Schottky Power Diodes

    NASA Technical Reports Server (NTRS)

    Scheick, Leif; Selva, Luis; Selva, Luis

    2004-01-01

    A novel catastrophic breakdown mode in reversed biased Silicon carbide diodes has been seen for low LET particles. These particles are too low in LET to induce SEB, however SEB was seen from particles of higher LET. The low LET mechanism correlates with second breakdown in diodes due to increase leakage and assisted charge injection from incident particles. Percolation theory was used to predict some basic responses of the devices, but the inherent reliability issue with silicon carbide have proven challenging.

  2. The effect of high temperatures on the electrical characteristics of Au/n-GaAs Schottky diodes

    NASA Astrophysics Data System (ADS)

    Tunhuma, S. M.; Auret, F. D.; Legodi, M. J.; Diale, M.

    2016-01-01

    In this study, the current-voltage (I-V) and capacitance-voltage (C-V) characteristics of Au/n-GaAs Schottky diodes have been measured over a wide temperature range, 80-480 K. The diodes were rectifying throughout the range and showed good thermal stability. Room temperature values for the ideality factor, I-V barrier height and C-V barrier height were found to be n=1.10, ϕIV=0.85 eV and ϕCV=0.96 eV, respectively. ϕIV increases and n decreases with an increase in temperature. We investigated the effect of elevated temperatures on the barrier height and ideality factor by measuring the diodes at a high temperature (annealing mode) then immediately afterwards measuring at room temperature (post annealing mode). The measurements indicate I-V characteristics that degrade permanently above 300 K. Permanent changes to the C-V characteristics were observed only above 400 K. We also noted a discrepancy in the C-V barrier height and carrier concentration between 340 and 400 K, which we attribute to the influence of the EL2 defect (positioned 0.83 eV below the conduction band minima) on the free carrier density. Consequently, we were able to fit the ϕCV versus temperature curve into two regions with temperature coefficients -6.9×10-4 eV/K and -2.2×10-4 eV/K above and below 400 K.

  3. Effect of Post Deposition Annealing Treatments on Properties of AZO Thin Films for Schottky Diode Applications.

    PubMed

    Singh, Shaivalini; Park, Si-Hyun

    2016-01-01

    High-quality aluminum (Al) doped ZnO (AZO) thin films were deposited on silicon substrates by RF sputtering at room temperature. The deposited films were annealed from the temperatures 350 °C to 650 °C in pure nitrogen (N₂) ambient. The effects of annealing on the microstructural, optical and electrical properties of the AZO films were investigated. A detailed analysis by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), Four Probe and Hall measurements was performed to study the properties of these AZO thin films. It was observed that all of the as-deposited and annealed AZO films have homogenous surfaces and hexagonal wurtzite structures with good crystalline quality. The study also suggested that there was an intermediate post annealing temperature (450 °C) at which the deposited ZnO film exhibit best surface characteristics. Pd/AZO Schottky devices were fabricated with 450 °C annealed AZO thin films and the parameters of Schottky devices were extracted from I-V characteristics. These results indicated that the Pd/AZO films were very much suitable for various optoelectronics applications particularly for metal semiconductor metal based UV detector application. PMID:27398537

  4. Electrical transport, magnetic properties of the half-metallic Fe 3O 4-based Schottky diode

    NASA Astrophysics Data System (ADS)

    Yan, Hong; Zhang, Ming; Yan, Hui

    2009-08-01

    Fe 3O 4 thin films were prepared successfully by using the rf-sputtering technique with Fe 2O 3 target. The inverse spinel structure of the film was determined by X-ray diffraction (XRD) and the single phase of the Fe 3O 4 was confirmed by the XPS measurements. The surface roughness increases with the increase of the partial pressure of hydrogen. A high saturated magnetic field, 5000 Oe, implies that there exist the antiphase boundaries (APBs) in the film. The higher coercive filed below T V is ascribed to the lower symmetry of the monoclinic structure. The temperature dependence of resistance shows a very clear Verwey transition and it is implied that the electrical transport behavior follows the variable-range hopping (VRH) mechanism from 40 to 300 K. The current vs. voltage curves of Fe 3O 4/Si Schottky heterojunction exhibits good rectifying property. The ideality factor and Schottky barrier height were obtained from the fitting curves calculated by the standard thermionic emission/diffusion model.

  5. Rapid thermal annealing effects on the electrical and structural properties of Ru/V/n-InP Schottky barrier diode

    NASA Astrophysics Data System (ADS)

    Padma, R.; Shanthi Latha, K.; Rajagopal Reddy, V.; Choi, Chel-Jong

    2015-07-01

    A Ru/V/n-InP Schottky barrier diode (SBD) is fabricated and investigated its electrical and structural properties as a function of annealing temperature. Measurements showed that the barrier height (BH) of the as-deposited Ru/V/n-InP SBD is found to be 0.83 eV (I-V) and 1.03 eV (C-V). Experimental results indicate that the SBD with high BH and low ideality factors (0.87 eV (I-V), 1.20 eV (C-V), and 1.12) can be achieved after annealing at 400 °C for 1 min in N2 atmosphere. Further, it is observed that the BH slightly decreases to 0.85 eV (I-V) and 1.09 eV (C-V) upon annealing at 500 °C. The BH, ideality factor and series resistance are also determined by Cheung's functions and Norde method. Further, the energy distribution of interface state density of Ru/V/n-InP SBD is calculated from the forward bias I-V characteristics as a function of annealing temperature. It is found that the interface state density decreases upon annealing at 400 °C and then slightly increases after annealing at 500 °C. The AES and XRD results revealed that the formation of indium phases at the Ru/V/n-InP interface could be the reason for the increase of BH upon annealing at 400 °C. The formation of phosphide phases at the interface may be the cause for the decrease of BH after annealing at 500 °C. The overall surface morphology of Ru/V Schottky contacts is considerably smooth at elevated temperatures.

  6. Temperature dependence of current-and capacitance-voltage characteristics of an Au/4H-SiC Schottky diode

    NASA Astrophysics Data System (ADS)

    Gülnahar, Murat

    2014-12-01

    In this study, the current-voltage (I-V) and capacitance-voltage (C-V) measurements of an Au/4H-SiC Schottky diode are characterized as a function of the temperature in 50-300 K temperature range. The experimental parameters such as ideality factor and apparent barrier height presents to be strongly temperature dependent, that is, the ideality factor increases and the apparent barrier height decreases with decreasing temperature, whereas the barrier height values increase with the temperature for C-V data. Likewise, the Richardson plot deviates at low temperatures. These anomaly behaviors observed for Au/4H-SiC are attributed to Schottky barrier inhomogeneities. The barrier anomaly which relates to interface of Au/4H-SiC is also confirmed by the C-V measurements versus the frequency measured in 300 K and it is interpreted by both Tung's lateral inhomogeneity model and multi-Gaussian distribution approach. The values of the weighting coefficients, standard deviations and mean barrier height are calculated for each distribution region of Au/4H-SiC using the multi-Gaussian distribution approach. In addition, the total effective area of the patches NAe is obtained at separate temperatures and as a result, it is expressed that the low barrier regions influence meaningfully to the current transport at the junction. The homogeneous barrier height value is calculated from the correlation between the ideality factor and barrier height and it is noted that the values of standard deviation from ideality factor versus q/3kT curve are in close agreement with the values obtained from the barrier height versus q/2kT variation. As a result, it can be concluded that the temperature dependent electrical characteristics of Au/4H-SiC can be successfully commented on the basis of the thermionic emission theory with both models.

  7. Concentration of uncompensated impurities as a key parameter of CdTe and CdZnTe crystals for Schottky diode x\\ssty{/}γ-ray detectors

    NASA Astrophysics Data System (ADS)

    Kosyachenko, L. A.; Lambropoulos, C. P.; Aoki, T.; Dieguez, E.; Fiederle, M.; Loukas, D.; Sklyarchuk, O. V.; Maslyanchuk, O. L.; Grushko, E. V.; Sklyarchuk, V. M.; Crocco, J.; Bensalah, H.

    2012-01-01

    In this paper we report on the strong impact of the concentration of uncompensated impurities on the detection efficiency of CdTe and Cd0.9Zn0.1Te Schottky diodes. The results of our study explain the observed poor detection properties of some Cd0.9Zn0.1Te detectors with resistivity and lifetime of carriers comparable to those of good CdTe detectors. We show that the concentration of uncompensated impurities in a highly efficient CdTe Schottky diode detector is several orders of magnitude higher than that of a CdZnTe, which does not register the gamma spectra of commonly used isotopes (59-662 keV) by using photoelectric measurements. The significant difference of the concentration of uncompensated impurities between CdTe and Cd0.9Zn0.1Te crystals is confirmed by our study of the temperature change of the resistivity and of the Fermi level energy. The degree of compensation of the donor complex, responsible for the electrical conductivity of the material, is much lower in the CdTe crystal compared to that in the Cd0.9Zn0.1Te crystal. The calculations of the detection efficiency of x/γ-radiation by a Schottky diode result in a dependence on the concentration of uncompensated impurities described by a curve with a pronounced maximum. The position of this maximum occurs at a concentration of uncompensated impurities which ranges from 3 × 1010 to 3 × 1012 cm-3 depending on the registered photon energy of x/γ-rays and on the lifetime of the charge carriers. Our measurements and calculations lead to the conclusion that the concentration of uncompensated impurities in this range is a necessary condition for the effective operation of x- and γ-ray Schottky diode detectors based on CdTe and Cd1-xZnxTe crystals.

  8. Effects of Post Annealing on I-V-T Characteristics of (Ni/Au)/Al0.09Ga0.91N Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Akkaya, Abdullah; Ayyıldız, Enise

    2016-04-01

    Post annealing is a simple, effective and suitable method for improving the diode parameters, especially when the used chemically stable substrates like Si, III-N and ternary alloys. In our work, we were applied this method to (Ni/Au)/Al0.09Ga0.91N Schottky Barrier Diodes (SBDs) and investigated by temperature-dependent current-voltage (I-V-T) characteristics at optimum conditions. Optimum annealing temperature was 600°C, which it’s determined with respect to have a highest barrier height value. The temperature-dependent electrical characteristics of the annealed at 600°C (Ni/Au)/Al0.09Ga0.91N SBDs were investigated in the wide temperature range of 95-315K. The diode parameters such as ideality factor (n) and Schottky barrier height (Фb0) were obtained to be strongly temperature dependent. The observed variation in Фb0 and n can be attributed to the spatial barrier inhomogeneities in Schottky barrier height by assuming a triple Gaussian distribution (TGD) of barrier heights (BHs) at 95-145K, 145-230K and 230-315K. The modified Richardson plots and T0 analysis was performed to provide an experimental Richardson constants and bias coefficients of the mean barrier height. Furthermore, the chemical composition of the contacts was examined by the XPS depth profile analysis.

  9. RF-to-DC Characteristics of Direct Irradiated On-Chip Gallium Arsenide Schottky Diode and Antenna for Application in Proximity Communication System

    PubMed Central

    Mustafa, Farahiyah; Hashim, Abdul Manaf

    2014-01-01

    We report the RF-to-DC characteristics of the integrated AlGaAs/GaAs Schottky diode and antenna under the direct injection and irradiation condition. The conversion efficiency up to 80% under direct injection of 1 GHz signal to the diode was achieved. It was found that the reduction of series resistance and parallel connection of diode and load tend to lead to the improvement of RF-to-DC conversion efficiency. Under direct irradiation from antenna-to-antenna method, the output voltage of 35 mV was still obtainable for the distance of 8 cm between both antennas in spite of large mismatch in the resonant frequency between the diode and the connected antenna. Higher output voltage in volt range is expected to be achievable for the well-matching condition. The proposed on-chip AlGaAs/GaAs HEMT Schottky diode and antenna seems to be a promising candidate to be used for application in proximity communication system as a wireless low power source as well as a highly sensitive RF detector. PMID:24561400

  10. A packaged Schottky diode as detector, harmonic mixer, and harmonic generator in the 25 500 GHz range

    NASA Astrophysics Data System (ADS)

    Goy, P.

    1982-03-01

    This paper describes experimental results obtained with a packaged GaAs Schottky barrier diode in contact with a coaxial connector and placed across waveguides for bands Ka, V, E, W or F. Among the microwave sources used for calibration were 9 carcinotrons in the frequency interval 51 490 GHz. As soon as the frequency F is above the waveguide cut-off frequency, the different characteristics do not depend critically on the waveguide size for V, E, W and F bands. The video detection sensitivity, of several 100 mV/mW at 50 GHz and below, decreases as F-4 in the range 51 500 GHz. Coupling an X-band centimeter frequency via the coaxial connector and a millimeter frequency via the waveguide permits harmonic mixing in the diode. Between 36 and 490 GHz, the harmonic mixing number varies from 3 up to the very large value 40 with conversion losses from 18 to 88 dB. The minimum detectable signal in the 100 kHz band can be as low as -90 dBm at 80 GHz. A noticeable millimeter power is available at the waveguide output from injected centimeter power by harmonic generation. Starting for instance with 100 mW around 11.5 GHz, we have measured 0.1 mW at 80 GHz and 0.1 μW at 230 GHz. To illustrate the possibility of creating usable millimeter and submillimeter wave without heavy equipment (such as carcinotrons or millimeter klystron) we report spectroscopic experiments in Rydberg atoms. Resonances have been observed up to 340 GHz by harmonic generation (28th harmonic) from an X-band klystron).

  11. Electric field modulation technique for high-voltage AlGaN/GaN Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Tang, Cen; Xie, Gang; Zhang, Li; Guo, Qing; Wang, Tao; Sheng, Kuang

    2013-10-01

    A novel structure of AlGaN/GaN Schottky barrier diode (SBD) featuring electric field optimization techniques of anode-connected-field-plate (AFP) and magnesium-doped p-type buried layer under the two-dimensional electron gas (2DEG) channel is proposed. In comparison with conventional AlGaN/GaN SBDs, the magnesium-doped p-type buried layer in the proposed structure can provide holes that can help to deplete the surface 2DEG. As a result, surface field strength around the electrode edges is significantly suppressed and the electric field along the channel is distributed more evenly. Through 2D numerical analysis, the AFP parameters (field plate length, LAFP, and field plate height, TAFP) and p-type buried layer parameters (p-type layer concentration, NP, and p-type layer thickness, TP) are optimized to achieve a three-equal-peak surface channel field distribution under exact charge balance conditions. A novel structure with a total drift region length of 10.5 μm and a magnesium-doped p-type concentration of 1 × 1017 cm-3 achieves a high breakdown voltage (VB) of 1.8 kV, showing 5 times improvement compared with the conventional SBD with the same device dimension.

  12. SiC Schottky Diode Detectors for Measurement of Actinide Concentrations from Alpha Activities in Molten Salt Electrolyte

    SciTech Connect

    Windl, Wolfgang; Blue, Thomas

    2013-01-28

    In this project, we have designed a 4H-SiC Schottky diode detector device in order to monitor actinide concentrations in extreme environments, such as present in pyroprocessing of spent fuel. For the first time, we have demonstrated high temperature operation of such a device up to 500 °C in successfully detecting alpha particles. We have used Am-241 as an alpha source for our laboratory experiments. Along with the experiments, we have developed a multiscale model to study the phenomena controlling the device behavior and to be able to predict the device performance. Our multiscale model consists of ab initio modeling to understand defect energetics and their effect on electronic structure and carrier mobility in the material. Further, we have developed the basis for a damage evolution model incorporating the outputs from ab initio model in order to predict respective defect concentrations in the device material. Finally, a fully equipped TCAD-based device model has been developed to study the phenomena controlling the device behavior. Using this model, we have proven our concept that the detector is capable of performing alpha detection in a salt bath with the mixtures of actinides present in a pyroprocessing environment.

  13. Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode

    NASA Astrophysics Data System (ADS)

    Olivero, P.; Forneris, J.; Gamarra, P.; Jakšić, M.; Giudice, A. Lo; Manfredotti, C.; Pastuović, Ž.; Skukan, N.; Vittone, E.

    2011-10-01

    The transport properties of a 4H-SiC Schottky diode have been investigated by the ion beam induced charge (IBIC) technique in lateral geometry through the analysis of the charge collection efficiency (CCE) profile at a fixed applied reverse bias voltage. The cross section of the sample orthogonal to the electrodes was irradiated by a rarefied 4 MeV proton microbeam and the charge pulses have been recorded as function of incident proton position with a spatial resolution of 2 μm. The CCE profile shows a broad plateau with CCE values close to 100% occurring at the depletion layer, whereas in the neutral region, the exponentially decreasing profile indicates the dominant role played by the diffusion transport mechanism. Mapping of charge pulses was accomplished by a novel computational approach, which consists in mapping the Gunn's weighting potential by solving the electrostatic problem by finite element method and hence evaluating the induced charge at the sensing electrode by a Monte Carlo method. The combination of these two computational methods enabled an exhaustive interpretation of the experimental profiles and allowed an accurate evaluation both of the electrical characteristics of the active region (e.g. electric field profiles) and of basic transport parameters (i.e. diffusion length and minority carrier lifetime).

  14. Temperature dependent barrier height and ideality factor of electrodeposited n-CdSe/Cu Schottky barrier diode

    SciTech Connect

    Mahato, S. Shiwakoti, N.; Kar, A. K.

    2015-06-24

    This article reports the measurement of temperature-dependent barrier height and ideality factor of n-CdSe/Cu Schottky barrier diode. The Cadmium Selenide (CdSe) thin films have been deposited by simple electrodeposition technique. The XRD measurements ravels the deposited single phase CdSe films are highly oriented on (002) plane and the average particle size has been calculated to be ~18 nm. From SEM characterization, it is clear that the surface of CdSe thin films are continuous, homogeneous and the film is well adhered to the substrate and consists of fine grains which are irregular in shape and size. Current-Voltage characteristics have been measured at different temperatures in the range (298 K – 353 K). The barrier height and ideality factor are found to be strongly temperature dependent. The inhomogenious barrier height increases and ideality factor decreases with increase in temperature. The expectation value has been calculated and its value is 0.30 eV.

  15. Annealing effect on the electrical and optical properties of Au/n-ZnO NWs Schottky diodes white LEDs

    NASA Astrophysics Data System (ADS)

    Soomro, M. Y.; Hussain, I.; Bano, N.; Nur, O.; Willander, M.

    2013-10-01

    We report the post-growth heat treatment effect on the electrical and the optical properties of hydrothermally grown zinc oxide (ZnO) nanowires (NWs) Schottky white light emitting diodes (LEDs). It was found that there is a changed in the electroluminescence (EL) spectrum when post growth annealing process was performed at 600 °C under nitrogen, oxygen and argon ambients. The EL spectrum for LEDs based on the as grown NWs show three bands red, green and blue centered at 724, 518 and 450 nm respectively. All devices based on ZnO NWs annealed in oxygen (O2), nitrogen (N2) and argon (Ar) ambient show blue shift in the violet and the red emissions whereas a red shift is observed in the green emission compared to the as grown NWs based device. The color rendering index (CRI) and the correlated color temperature (CCT) of all LEDs were calculated to be in the range 78-91 and 2753-5122 K, respectively. These results indicate that light from the LEDs can be tuned from cold white light to warm white light by post growth annealing.

  16. The effect of annealing temperature on the electrical characterization of Co/n type GaP Schottky diode

    SciTech Connect

    Orak, İ.; Ejderha, K.; Sönmez, E.; Alanyalıoğlu, M.; Turut, A.

    2015-01-15

    The Co/n-GaP nano-Schottky diodes have been fabricated to investigate effect of annealing temperature on the characteristics of the device. DC Magnetron sputtering technique has been used for Co metallic contact. The samples have been annealed for three minutes at 400 °C and 600 °C. XRD analyzes of the devices subjected to thermal annealing process have been investigated. Surface images have been taken with atomic force microscopy (AFM) in order to examine the morphology of the surface of the metal layer before and after the annealing the sample. The current–voltage (I–V) measurements taken at room temperature have shown that the ideality factor and series resistance decrease with the increasing annealing temperature. The ideality factor was found to be 1.02 for sample annealed at 400 °C. Before and after annealing, depending on the temperature measurement, the capacitance–frequency (C–f), and conductance–frequency (G–f) have been measured, and graphs have been plotted.

  17. The impact of surface morphology on C- and Si-face 4H-SiC Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Lee, Kung-Yen; Huang, Chih-Fang; Chen, Wenzhou; Capano, Michael A.

    2007-12-01

    The goal of this research is to investigate the correlation of reverse characteristics of Schottky barrier diodes (SBDs) and surface morphological defects on 4° (off-axis) carbon (C) face, 4° and 8° silicon (Si) face 4H-SiC. Different dimensions of SBDs with boron-implanted edge terminations are fabricated on 4° C-face, 4° and 8° Si-face 4H-SiC samples. The ideality factor for these three samples is about 1.1. Average breakdown voltages of 4° Si-face 4H-SiC SBDs are higher than the other two samples, particularly for large size SBDs. Breakdown voltages of 1500 and 2000 μm 4° Si-face SBDs can reach over 1000 V. This value is about two times higher than the other two samples, though the root-mean-square (RMS) roughness of 4° Si-face samples obtained from atomic force microscopy (AFM) is 3.5 nm. The yield of 1500 and 2000 μm 4° Si-face 4H-SiC SBDs with a breakdown voltage over 1000 V is more than 50%, much higher than the other two samples.

  18. The electrical characterization of Ag/PTCDA/PEDOT:PSS/p-Si Schottky diode by current-voltage characteristics

    NASA Astrophysics Data System (ADS)

    Tahir, Muhammad; Sayyad, Muhammad Hassan; Wahab, Fazal; Khan, Dil Nawaz; Aziz, Fakhra

    2013-04-01

    The Ag/PTCDA/PEDOT:PSS/p-Si Schottky diode has been fabricated by adding a layer of organic compound 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) on top of the p-Si for which the junction characteristics have been investigated. The electronic properties of the device have been studied by the conventional I-V and the Norde's methods. For conventional I-V measurements the rectifying behavior has been observed with a rectification ratio of 236. The barrier height and ideality factor values of 0.81 eV and 3.5, respectively, for the structure have been obtained from the forward bias I-V characteristics. Various electrical parameters such as reverse saturation current, series resistance and shunt resistance have been calculated from the analysis of experimental I-V results and discussed in detail. The barrier height and the series resistance determined by the Norde's function are found in good agreement with the values calculated from conventional I-V measurements. The charge conduction mechanism has also been discussed.

  19. Vertical junction photodetectors based on reduced graphene oxide/silicon Schottky diodes

    NASA Astrophysics Data System (ADS)

    Zhu, Miao; Li, Xinming; Guo, Yibo; Li, Xiao; Sun, Pengzhan; Zang, Xiaobei; Wang, Kunlin; Zhong, Minlin; Wu, Dehai; Zhu, Hongwei

    2014-04-01

    Reduced graphene oxide (RGO) has been employed as an electrode for a series of vertically structured photodetectors. Compared with mechanically exfoliated or chemical vapor deposited graphene, RGO possesses more oxygen containing groups and defects, which are proved to be favorable to enhance the performance of photodetectors. As a matter of fact, RGO with different reduction levels can be readily obtained by varying the annealing temperature. The synthesis procedures for the RGO material are suitable for large scale production and its performance can be effectively improved by functionalization or element doping. For RGO-based devices, the Schottky junction properties and photoelectric conversion have been investigated, primarily by analyzing their current-voltage characteristics. Subsequently, the ON/OFF ratio, responsivity and detectivity of the photodetectors were closely examined, proving that the RGO material could be effectively utilized as the electrode material; also, their relationship with the RGO reduction levels has also been explored. By analyzing the response/recovery speed of the RGO-based photodetectors, we have studied the effects of oxygen-containing functional groups and crystalline defects on the photoelectric conversion.Reduced graphene oxide (RGO) has been employed as an electrode for a series of vertically structured photodetectors. Compared with mechanically exfoliated or chemical vapor deposited graphene, RGO possesses more oxygen containing groups and defects, which are proved to be favorable to enhance the performance of photodetectors. As a matter of fact, RGO with different reduction levels can be readily obtained by varying the annealing temperature. The synthesis procedures for the RGO material are suitable for large scale production and its performance can be effectively improved by functionalization or element doping. For RGO-based devices, the Schottky junction properties and photoelectric conversion have been investigated

  20. Forward-bias diode parameters, electronic noise, and photoresponse of graphene/silicon Schottky junctions with an interfacial native oxide layer

    NASA Astrophysics Data System (ADS)

    An, Yanbin; Behnam, Ashkan; Pop, Eric; Bosman, Gijs; Ural, Ant

    2015-09-01

    Metal-semiconductor Schottky junction devices composed of chemical vapor deposition grown monolayer graphene on p-type silicon substrates are fabricated and characterized. Important diode parameters, such as the Schottky barrier height, ideality factor, and series resistance, are extracted from forward bias current-voltage characteristics using a previously established method modified to take into account the interfacial native oxide layer present at the graphene/silicon junction. It is found that the ideality factor can be substantially increased by the presence of the interfacial oxide layer. Furthermore, low frequency noise of graphene/silicon Schottky junctions under both forward and reverse bias is characterized. The noise is found to be 1/f dominated and the shot noise contribution is found to be negligible. The dependence of the 1/f noise on the forward and reverse current is also investigated. Finally, the photoresponse of graphene/silicon Schottky junctions is studied. The devices exhibit a peak responsivity of around 0.13 A/W and an external quantum efficiency higher than 25%. From the photoresponse and noise measurements, the bandwidth is extracted to be ˜1 kHz and the normalized detectivity is calculated to be 1.2 ×109 cm Hz1/2 W-1. These results provide important insights for the future integration of graphene with silicon device technology.

  1. Design, fabrication and characterization of a Schottky diode on an AlGaAs/GaAs HEMT structure for on-chip RF power detection

    NASA Astrophysics Data System (ADS)

    Mustafa, Farahiyah; Parimon, Norfarariyanti; Hashim, Abdul Manaf; Abd Rahman, Shaharin Fadzli; Abdul Rahman, Abdul Rahim; Osman, Mohd Nizam

    2010-02-01

    A Schottky diode was designed and fabricated on an n-AlGaAs/GaAs high electron mobility transistor (HEMT) structure for RF power detection. The processing steps used in the fabrication were the conventional steps used in standard GaAs processing. Current-voltage measurements showed that the devices had rectifying properties with a barrier height of 0.5289-0.5468 eV. The fabricated Schottky diodes detected RF signals well and their cut-off frequencies up to 20 GHz were estimated in direct injection experiments. To achieve a high cut-off frequency, a smaller Schottky contact area is required. The feasibility of direct integration with the planar dipole antenna via a coplanar waveguide transmission line without insertion of matching circuits was discussed. A higher cut-off frequency can also be achieved by reducing the length of the coplanar waveguide transmission line. These preliminary results represent a breakthrough as regards direct on-chip integration technology, towards the realization of a ubiquitous network society.

  2. Temperature-Dependent Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Ni/Cu/n-InP Schottky Barrier Diodes

    NASA Astrophysics Data System (ADS)

    Munikrishana Reddy, Y.; Nagaraj, M. K.; Siva Pratap Reddy, M.; Lee, Jung-Hee; Rajagopal Reddy, V.

    2013-04-01

    The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of Ni/Cu/n-InP Schottky barrier diodes are studied over a wide temperature range, from 210 K to 420 K. The I-V characteristics display anomalous thermal behavior. The apparent barrier height decays, and the ideality factor grows at low temperatures, and the series resistances resulting from Cheung's and Norde's procedures are markedly temperature dependent. The nonlinearity of the Richardson plot and the strong temperature dependence of the Schottky-barrier parameters indicate that the interface is spatially inhomogeneous. Plots of the zero-bias barrier height as a function of 1/(2kT) points to a Gaussian distribution of barrier heights with 0.90 eV mean height and 0.014 eV standard deviation. When this distribution is accounted for, a Richardson of 6.5 A/(cm K)2 results, relatively close to the 9.4/(cm K)2 predicted by theory. We conclude that, combined with a Gaussian distribution of barrier heights, the thermionic-emission mechanism explains the temperature-dependent I-V and C-V characteristics of the studied Schottky-barrier diodes.

  3. Analysis of Schottky Contact Formation in Coplanar Au/ZnO/Al Nanogap Radio Frequency Diodes Processed from Solution at Low Temperature.

    PubMed

    Semple, James; Rossbauer, Stephan; Anthopoulos, Thomas D

    2016-09-01

    Much work has been carried out in recent years in fabricating and studying the Schottky contact formed between various metals and the n-type wide bandgap semiconductor zinc oxide (ZnO). In spite of significant progress, reliable formation of such technologically interesting contacts remains a challenge. Here, we report on solution-processed ZnO Schottky diodes based on a coplanar Al/ZnO/Au nanogap architecture and study the nature of the rectifying contact formed at the ZnO/Au interface. Resultant diodes exhibit excellent operating characteristics, including low-operating voltages (±2.5 V) and exceptionally high current rectification ratios of >10(6) that can be independently tuned via scaling of the nanogap's width. The barrier height for electron injection responsible for the rectifying behavior is studied using current-voltage-temperature and capacitance-voltage measurements (C-V) yielding values in the range of 0.54-0.89 eV. C-V measurements also show that electron traps present at the Au/ZnO interface appear to become less significant at higher frequencies, hence making the diodes particularly attractive for high-frequency applications. Finally, an alternative method for calculating the Richardson constant is presented yielding a value of 38.9 A cm(-2) K(-2), which is close to the theoretically predicted value of 32 A cm(-2) K(-2). The implications of the obtained results for the use of these coplanar Schottky diodes in radio frequency applications is discussed. PMID:27530144

  4. Analysis of surface plasmon polariton enhancement in photodetection by Al—GaAs Schottky diodes

    NASA Astrophysics Data System (ADS)

    Tamm, I. R.; Dawson, P.; Sellai, A.; Pate, M. A.; Grey, R.; Hill, G.

    1993-10-01

    The surface plasmon polariton mediated photoresponse from Al—GaAs diodes is examined in a prism-air gap-diode configuration as a function of both the wavelength of the incident light and thickness of the Al electrode. The experimental data shows a pronounced dip in reflectance as a function of internal angle of incidence in the prism, due to the excitation of the surface plasmon polariton at the Al-air interface, and a corresponding peak in device photosignal. Careful modelling of reflectance and quantum efficiency data shows that the bulk of the signal is generated by light which is re-radiated from this surface mode into the semiconductor substrate where it is absorbed by the creation of electron-hole pairs in the depletion region. This holds for all the wavelengths used here (all are shorter than the GaAs absorption edge) and across the thickness range of the Al electrodes (20-50 nm). Quantum efficiencies in the range 0.5-22% and enhancement factors of typically 7.5 were recorded in this investigation.

  5. Roles of lightly doped carbon in the drift layers of vertical n-GaN Schottky diode structures on freestanding GaN substrates

    NASA Astrophysics Data System (ADS)

    Tanaka, Takeshi; Kaneda, Naoki; Mishima, Tomoyoshi; Kihara, Yuhei; Aoki, Toshichika; Shiojima, Kenji

    2015-04-01

    We studied the roles of lightly doped carbon in a series of n-GaN Schottky diode epitaxial structures on freestanding GaN substrates, and evaluated the effects of the doping on diode performances. A large variation of compensation ratio was observed for carbon doping at (1-2) × 1016 cm-3. A model was proposed to explain this phenomenon, in which a vulnerable balance between donor-type CGa and deep acceptor CN strongly affected the free-carrier generation. Application of Norde plots and reverse biased leakage current in current-voltage measurements suggested provisional optimization for a free-carrier concentration of 8 × 1015 cm-3 to achieve a tradeoff between breakdown voltage and on-resistance of the n-GaN diodes.

  6. Dynamics of modification of Ni/n-GaN Schottky barrier diodes irradiated at low temperature by 200 MeV Ag{sup 14+} ions

    SciTech Connect

    Kumar, Ashish; Kumar, Tanuj; Kanjilal, D.; Hähnel, A.; Singh, R.

    2014-01-20

    Ni/GaN Schottky barrier diodes were irradiated with 200 MeV Ag ions up to fluence of 1 × 10{sup 11} ions/cm{sup 2} at the substrate temperature of 80 K. Post-irradiation current-voltage measurements showed that the ideality factor, n increased and the reverse leakage current, I{sub R} decreased with increase in fluence. But Schottky barrier height, ϕ{sub b} increased only marginally with increase in ion fluence. In situ resistivity measurements showed orders of magnitude increase in resistivity of GaN epitaxial film with irradiation fluence. Cross-sectional transmission electron microscopy images revealed the presence of defect clusters in bulk GaN after irradiation.

  7. Fabrication and electrical characterization of pyrrole-aniline copolymer-based Schottky diodes

    NASA Astrophysics Data System (ADS)

    Sönmezoğlu, S.; Durmuş, C. B.; Taş, R.; Çankaya, G.; Can, M.

    2011-05-01

    In this work, pyrrole-aniline copolymer/p-Si structure has been fabricated by forming a thin organic copolymer film on a p-Si wafer. A good rectifying behavior was seen from the current-voltage (I-V) characteristics. The characteristic parameters of the structure such as barrier height, ideality factor, interface states density and series resistance were determined from the electrical measurements using I-V, Cheung's, and modified Norde's function. The calculated barrier height values from different methods have shown the consistency of the approaches. The obtained ideality factor which is greater than unity refers to the deviation from ideal diode characteristics. This deviation can be attributed to secondary mechanisms, which include interface dipoles due to interface doping or specific interface structure, as well as fabrication-induced defects at the interface. The energy distribution of interface-state density of the copolymer-based structure was determined, and the interface-state density was found to vary from 1.27 × 1016 cm-2 eV-1 in (0.07 - Ev) eV to 2.45 × 1015 cm-2 eV-1 in (0.52 - Ev) eV. Furthermore, these copolymers were characterized with UV-vis, FTIR techniques, and thermal analysis.

  8. Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC

    NASA Astrophysics Data System (ADS)

    Omotoso, E.; Meyer, W. E.; Auret, F. D.; Paradzah, A. T.; Diale, M.; Coelho, S. M. M.; Janse van Rensburg, P. J.; Ngoepe, P. N. M.

    2015-12-01

    Current-voltage, capacitance-voltage and conventional deep level transient spectroscopy at temperature ranges from 40 to 300 K have been employed to study the influence of alpha-particle irradiation from an 241Am source on Ni/4H-SiC Schottky contacts. The nickel Schottky barrier diodes were resistively evaporated on n-type 4H-SiC samples of doping density of 7.1 × 1015 cm-3. It was observed that radiation damage caused an increase in ideality factors of the samples from 1.04 to 1.07, an increase in Schottky barrier height from 1.25 to 1.31 eV, an increase in series resistance from 48 to 270 Ω but a decrease in saturation current density from 55 to 9 × 10-12 A m-2 from I-V plots at 300 K. The free carrier concentration of the sample decreased slightly after irradiation. Conventional DLTS showed peaks due to four deep levels for as-grown and five deep levels after irradiation. The Richardson constant, as determined from a modified Richardson plot assuming a Gaussian distribution of barrier heights for the as-grown and irradiated samples were 133 and 151 A cm-2 K-2, respectively. These values are similar to literature values.

  9. Spectroscopic properties and radiation damage investigation of a diamond based Schottky diode for ion-beam therapy microdosimetry

    SciTech Connect

    Verona, C.; Marinelli, Marco; Verona-Rinati, G.; Magrin, G.; Solevi, P.; Mayer, R.; Grilj, V.; Jakšić, M.

    2015-11-14

    In this work, a detailed analysis of the properties of a novel microdosimeter based on a synthetic single crystal diamond is reported. Focused ion microbeams were used to investigate the device spectropscopic properties as well as the induced radiation damage effects. A diamond based Schottky diode was fabricated by chemical vapor deposition with a very thin detecting region, about 400 nm thick (approximately 1.4 μm water equivalent thickness), corresponding to the typical size in microdosimetric measurements. A 200 × 200 μm{sup 2} square metallic contact was patterned on the diamond surface by standard photolithography to define the sensitive area. Experimental measurements were carried out at the Ruder Boškovic′ Institute microbeam facility using 4 MeV carbon and 5 MeV silicon ions. Ion beam induced charge maps were employed to characterize the microdosimeter response in terms of its charge collection properties. A stable response with no evidence of polarization or memory effects was observed up to the maximum investigated ion beam flux of about 1.7 × 10{sup 9} ions·cm{sup −2}·s{sup −1}. A homogeneity of the response about 6% was found over the sensitive region with a well-defined confinement of the response within the active area. Tests of the radiation damage effect were performed by selectively irradiating small areas of the device with different ion fluences, up to about 10{sup 12} ions/cm{sup 2}. An exponential decrease of the charge collection efficiency was observed with a characteristic decay constant of about 4.8 MGy and 1 MGy for C and Si ions, respectively. The experimental data were analyzed by means of GEANT4 Monte Carlo simulations. A direct correlation between the diamond damaging effect and the Non Ionizing Energy Loss (NIEL) fraction was found. In particular, an exponential decay of the charge collection efficiency with an exponential decay as a function of NIEL is observed, with a characteristic constant of about

  10. Analysis of temperature-dependant current-voltage characteristics and extraction of series resistance in Pd/ZnO Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Mayimele, M. A.; van Rensburg, J. P. Janse; Auret, F. D.; Diale, M.

    2016-01-01

    We report on the analysis of current voltage (I-V) measurements performed on Pd/ZnO Schottky barrier diodes (SBDs) in the 80-320 K temperature range. Assuming thermionic emission (TE) theory, the forward bias I-V characteristics were analysed to extract Pd/ZnO Schottky diode parameters. Comparing Cheung's method in the extraction of the series resistance with Ohm's law, it was observed that at lower temperatures (T<180 K) the series resistance decreased with increasing temperature, the absolute minimum was reached near 180 K and increases linearly with temperature at high temperatures (T>200 K). The barrier height and the ideality factor decreased and increased, respectively, with decrease in temperature, attributed to the existence of barrier height inhomogeneity. Such inhomogeneity was explained based on TE with the assumption of Gaussian distribution of barrier heights with a mean barrier height of 0.99 eV and a standard deviation of 0.02 eV. A mean barrier height of 0.11 eV and Richardson constant value of 37 A cm-2 K-2 were determined from the modified Richardson plot that considers the Gaussian distribution of barrier heights.

  11. Electrical characteristics of Mo/4H-SiC Schottky diodes having ion-implanted guard rings: temperature and implant-dose dependence

    NASA Astrophysics Data System (ADS)

    Latreche, A.; Ouennoughi, Z.; Sellai, A.; Weiss, R.; Ryssel, H.

    2011-08-01

    The electrical characteristics of ion-implanted guard rings for molybdenum (Mo) Schottky diodes on 4H-SiC are analyzed on the basis of the standard thermionic emission model and the assumption of a Gaussian distribution of the barrier height. For edge termination, high-resistivity guard rings manufactured by carbon and aluminum ion-implanted areas were used. Extractions of barrier heights of molybdenum on silicon carbide (4H-SiC) Schottky diodes have been performed on structures with various gate metallization, using both current-voltage-temperature (I-V-T) and capacitance-voltage (C-V) measurements. Characteristic features of the Schottky barrier height (SBH) are considered in relation to the specific dose of the carbon- or aluminum-implanted guard ring. Contacts showed excellent Schottky behavior ideality factors between 1.02 and 1.24 in the range of 303-473 K. The measured SBHs were between 0.92 and 1.17 eV in the same temperature range from I-V-T characteristics. The variations in the barrier height, which is significantly temperature- and implantation-dose-dependent, are well fitted to a single Gaussian distribution function. Experimental results agree reasonably well by using this approach, particularly for carbon implantation dose of 1.75 × 1014 cm-2, and a mean barrier height (\\bar \\Phi _{B0} ) of 1.22 eV and zero bias standard deviation σ0 = 0.067 V have been obtained. Furthermore, the modified Richardson plot according to the Gaussian distribution model resulted in a mean barrier height (\\bar \\Phi _{B0} ) and a Richardson constant (A*) of 1.22 eV and 148 A cm-2 K-2, respectively. The A* value obtained from this plot is in very close agreement with the theoretical value of 146 A cm-2 K-2 for n-type 4H-SiC. Therefore, it has been concluded that the temperature dependence of the forward (I-V) characteristics of the Mo/4H-SiC contacts can be successfully explained on the basis of a thermionic emission conduction mechanism with Guassianly distributed

  12. Nano-scale NiSi and n-type silicon based Schottky barrier diode as a near infra-red detector for room temperature operation

    NASA Astrophysics Data System (ADS)

    Roy, S.; Midya, K.; Duttagupta, S. P.; Ramakrishnan, D.

    2014-09-01

    The fabrication of nano-scale NiSi/n-Si Schottky barrier diode by rapid thermal annealing process is reported. The characterization of the nano-scale NiSi film was performed using Micro-Raman Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). The thickness of the film (27 nm) has been measured by cross-sectional Secondary Electron Microscopy and XPS based depth profile method. Current-voltage (I-V) characteristics show an excellent rectification ratio (ION/IOFF = 105) at a bias voltage of ±1 V. The diode ideality factor is 1.28. The barrier height was also determined independently based on I-V (0.62 eV) and high frequency capacitance-voltage technique (0.76 eV), and the correlation between them has explained. The diode photo-response was measured in the range of 1.35-2.5 μm under different reverse bias conditions (0.0-1.0 V). The response is observed to increase with increasing reverse bias. From the photo-responsivity study, the zero bias barrier height was determined to be 0.54 eV.

  13. Nano-scale NiSi and n-type silicon based Schottky barrier diode as a near infra-red detector for room temperature operation

    SciTech Connect

    Roy, S.; Midya, K.; Duttagupta, S. P.; Ramakrishnan, D.

    2014-09-28

    The fabrication of nano-scale NiSi/n-Si Schottky barrier diode by rapid thermal annealing process is reported. The characterization of the nano-scale NiSi film was performed using Micro-Raman Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). The thickness of the film (27 nm) has been measured by cross-sectional Secondary Electron Microscopy and XPS based depth profile method. Current–voltage (I–V) characteristics show an excellent rectification ratio (I{sub ON}/I{sub OFF} = 10⁵) at a bias voltage of ±1 V. The diode ideality factor is 1.28. The barrier height was also determined independently based on I–V (0.62 eV) and high frequency capacitance–voltage technique (0.76 eV), and the correlation between them has explained. The diode photo-response was measured in the range of 1.35–2.5 μm under different reverse bias conditions (0.0–1.0 V). The response is observed to increase with increasing reverse bias. From the photo-responsivity study, the zero bias barrier height was determined to be 0.54 eV.

  14. Analysis of the electrical properties of Cr/n-BaSi2 Schottky junction and n-BaSi2/p-Si heterojunction diodes for solar cell applications

    NASA Astrophysics Data System (ADS)

    Du, Weijie; Baba, Masakazu; Toko, Kaoru; Hara, Kosuke O.; Watanabe, Kentaro; Sekiguchi, Takashi; Usami, Noritaka; Suemasu, Takashi

    2014-06-01

    Current status and future prospects towards BaSi2 pn junction solar cells are presented. As a preliminary step toward the formation of BaSi2 homojunction diodes, diodes with a Cr/n-BaSi2 Schottky junction and an n-BaSi2/p-Si hetero-junction have been fabricated to investigate the electrical properties of the n-BaSi2. Clear rectifying properties were observed in the current density versus voltage characteristics in both diodes. From the capacitance-voltage measurements, the build-in potential, VD, was 0.53 V in the Cr/n-BaSi2 Schottky junction diode, and the Schottky barrier height was 0.73 eV calculated from the thermoionic emission theory; the VD was about 1.5 V in the n-BaSi2/p-Si hetero-junction diode, which was consistent with the difference in the Fermi level between the n-BaSi2 and the p-Si.

  15. Schottky barrier diodes of corundum-structured gallium oxide showing on-resistance of 0.1 mΩ·cm2 grown by MIST EPITAXY®

    NASA Astrophysics Data System (ADS)

    Oda, Masaya; Tokuda, Rie; Kambara, Hitoshi; Tanikawa, Tomochika; Sasaki, Takahiro; Hitora, Toshimi

    2016-02-01

    Thin-film corundum-structured gallium oxide (α-Ga2O3) Schottky barrier diodes (SBDs) were fabricated by growing α-Ga2O3 layers on sapphire substrates by the safe, low-cost, and energy-saving MIST EPITAXY® technique, followed by lifting off the α-Ga2O3 layers from the substrates. The SBDs exhibited on-resistance and breakdown voltage of 0.1 mΩ·cm2 and 531 V (SBD1) or 0.4 mΩ·cm2 and 855 V (SBD2), respectively. These results will encourage the future evolution of low-cost and high-performance SBDs with α-Ga2O3.

  16. Frequency dependent negative capacitance effect and dielectric properties of swift heavy ion irradiated Ni/oxide/n-GaAs Schottky diode

    NASA Astrophysics Data System (ADS)

    Bobby, A.; Shiwakoti, N.; Verma, S.; Asokan, K.; Antony, B. K.

    2016-05-01

    The Ni/n-GaAs Schottky barrier diode having thin interfacial oxide layer was subjected to 25 MeV C4+ ion irradiation at selected fluences. The in-situ capacitance and dielectric properties were investigated in the 1 KHz to 5 MHz frequency range. The results show a decrease in capacitance with increase in ion fluence at low frequencies. Interestingly, a negative capacitance effect was also observed in this frequency range in all the samples. As a consequence, changes were observed in parameters like series resistance, conductance, dielectric loss, dielectric constant, loss tangent and ac electrical conductivity. At high frequencies, the capacitance reaches the geometric value 'C0'. The results were interpreted in terms of the generation of irradiation induced traps, carrier capture and emission from deep and shallow states and its frequency dependent saturation effects.

  17. Real-time continuous-wave terahertz line scanner based on a compact 1 × 240 InGaAs Schottky barrier diode array detector.

    PubMed

    Han, Sang-Pil; Ko, Hyunsung; Kim, Namje; Lee, Won-Hui; Moon, Kiwon; Lee, Il-Min; Lee, Eui Su; Lee, Dong Hun; Lee, Wangjoo; Han, Seong-Tae; Choi, Sung-Wook; Park, Kyung Hyun

    2014-11-17

    We demonstrate real-time continuous-wave terahertz (THz) line-scanned imaging based on a 1 × 240 InGaAs Schottky barrier diode (SBD) array detector with a scan velocity of 25 cm/s, a scan line length of 12 cm, and a pixel size of 0.5 × 0.5 mm². Foreign substances, such as a paper clip with a spatial resolution of approximately 1 mm that is hidden under a cracker, are clearly detected by this THz line-scanning system. The system consists of the SBD array detector, a 200-GHz gyrotron source, a conveyor system, and several optical components such as a high-density polyethylene cylindrical lens, metal cylindrical mirror, and THz wire-grid polarizer. Using the THz polarizer, the signal-to-noise ratio of the SBD array detector improves because the quality of the source beam is enhanced. PMID:25402136

  18. Traps and defects in pre- and post-proton irradiated AlGaN-GaN high electron mobility transistors and AlGaN Schottky diodes

    NASA Astrophysics Data System (ADS)

    Sin, Yongkun; Foran, Brendan; Presser, Nathan; LaLumondiere, Stephen; Lotshaw, William; Moss, Steven C.

    2013-03-01

    High electron mobility transistors (HEMTs) based on AlGaN-GaN hetero-structures are promising for both commercial and military applications that require high voltage, high power, and high efficiency operation. Study of reliability and radiation effects of AlGaN-GaN HEMTs is necessary before solid state power amplifiers based on GaN HEMT technology are successfully deployed in satellite communication systems. Several AlGaN HEMT manufacturers have recently reported encouraging reliability data, but long-term reliability of these devices in the space environment still remains a major concern because a large number of traps and defects are present both in the bulk as well as at the surface leading to undesirable characteristics. This study is to investigate the effects of the AlGaN-GaN HEMTs and AlGaN Schottky diodes irradiated with protons.

  19. An Integrated 520-600 GHz Sub-Harmonic Mixer and Tripler Combination Based on GaAs MMIC Membrane Planar Schottky Diodes

    NASA Technical Reports Server (NTRS)

    Thomas, B.; Gill, J.; Maestrini, A.; Lee, C.; Lin, R.; Sin, S.; Peralta, A.; Mehdi, I.

    2010-01-01

    We present here the design, development and test of an integrated sub-millimeter front-end featuring a 520-600 GHz sub-harmonic mixer and a 260-300 GHz frequency tripler in a single cavity. Both devices used GaAs MMIC membrane planar Schottky diode technology. The sub-harmonic mixer/tripler circuit has been tested using conventional machined as well as silicon micro-machined blocks. Measurement results on the metal block give best DSB mixer noise temperature of 2360 K and conversion losses of 7.7 dB at 520 GHz. Preliminary results on the silicon micro-machined blocks give a DSB mixer noise temperature of 4860 K and conversion losses of 12.16 dB at 540 GHz. The LO input power required to pump the integrated tripler/sub-harmonic mixer for both packages is between 30 and 50 mW.

  20. An Integrated 520-600 GHz Sub-Harmonic Mixer and Tripler Combination Based on GaAs MMIC Membrane Planar Schottky Diodes

    NASA Technical Reports Server (NTRS)

    Thomas, B.; Gill, J.; Maestrini, A.; Lee, C.; Lin, R.; Sin, S.; Peralta, A.; Mehdi, I.

    2011-01-01

    We present here the design, development and test of an integrated sub-millimeter front-end featuring a 520-600 GHz sub-harmonic mixer and a 260-300 GHz frequency tripler in a single cavity. Both devices used GaAs MMIC membrane planar Schottky diode technology. The sub-harmonic mixer/tripler circuit has been tested using conventional machined as well as silicon micro-machined blocks. Measurement results on the metal block give best DSB mixer noise temperature of 2360 K and conversion losses of 7.7 dB at 520 GHz. Preliminary results on the silicon micro-machined blocks give a DSB mixer noise temperature of 4860 K and conversion losses of 12.16 dB at 540 GHz. The LO input power required to pump the integrated tripler/sub-harmonic mixer for both packages is between 30 and 50 mW

  1. CoPt ferromagnetic injector in light-emitting Schottky diodes based on InGaAs/GaAs nanostructures

    SciTech Connect

    Zdoroveyshchev, A. V. Dorokhin, M. V.; Demina, P. B.; Kudrin, A. V.; Vikhrova, O. V.; Ved’, M. V.; Danilov, Yu. A.; Erofeeva, I. V.; Krjukov, R. N.; Nikolichev, D. E.

    2015-12-15

    The possibility of fabricating a ferromagnetic injector based on a near-equiatomic CoPt alloy with pronounced perpendicular magnetization anisotropy in the InGaAs/GaAs spin light-emitting diode is shown. The physical properties of experimental spin light-emitting diode prototypes are comprehensively studied. Circularly polarized electroluminescence of fabricated diodes is obtained in zero magnetic field due to the remanent magnetization of CoPt layers.

  2. Conduction mechanism in highly doped β-Ga2O3(\\bar{2}01) single crystals grown by edge-defined film-fed growth method and their Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Oishi, Toshiyuki; Harada, Kazuya; Koga, Yuta; Kasu, Makoto

    2016-03-01

    Edge-defined fed-grown (\\bar{2}01) β-Ga2O3 single crystals with high electron concentration of 3.9 × 1018 cm-3 at 300 K were characterized by Hall effect measurement, and Schottky barrier diodes have been demonstrated. Electron mobility was as high as 74 cm2/(V·s) at 300 K regardless of the high doping concentration. The electron concentration did not change substantially in the low temperature below 160 K. This properties can be explained by the two-band model due to the inter-band conduction. On the Schottky barrier diodes, the rectification characteristics were clearly observed, and the current density of 96.8 A/cm2 at the forward voltage of 1.6 V was obtained.

  3. Comparative study of the temperature-dependent dielectric properties of Au/PPy/n-Si (MPS)-type Schottky barrier diodes

    NASA Astrophysics Data System (ADS)

    Gümüş, Ahmet; Ersöz, Gülçin; Yücedağ, İbrahim; Bayrakdar, Sümeyye; Altindal, Şemsettin

    2015-09-01

    The dielectric properties of Au/PPy/n-Si metal-polymer-semiconductor (MPS)-type Schottky barrier diodes (SBDs) were investigated by using capacitance-voltage ( C-V) and conductancevoltage ( G/ω-V) measurements at various temperatures and voltages at frequencies of 100 kHz and 500 kHz. Both the real and the imaginary parts of the complex dielectric constant and dielectric loss ( ɛ', ɛ″) and of the electric modulus ( M', M″), as well as the conductivity (σ ac ), were found to depend strongly on the temperature and the voltage. Both the C and G/ω values increased with increasing applied voltage and had inversion, depletion, and accumulation regions as with a metal-insulator-semiconductor (MIS) type behavior. Both the dielectric constant ( ɛ') and the dielectric loss ( ɛ″) increased with increasing temperature and decreased with increasing frequency. The loss tangent (tan δ) vs. temperature curve had a peak at about 200 K for both frequencies. The M' and the M″ values decreased with increasing temperature and became independent of the frequency at high temperatures. The series resistance ( R s ) of the diode decreased with increasing temperature for the two frequencies while the σ ac increased. Such behaviors of the dielectric properties with temperature were attributed to the restructuring and reordering of charges at interface states/traps due to the varying temperature, the interfacial polarization, and the interfacial polymer layer. ln(σ ac ) vs. q/kT plots had two distinct linear regions with different slopes for the two frequencies. Such behaviors of these plots confirmed the existence of two different conduction mechanisms corresponding to low and high temperatures. The values of the activation energy ( E a ) were obtained from the slopes of these plots, and its value at low temperatures was considerably lower than that at high temperatures.

  4. Correlation between morphological defects, electron beam-induced current imaging, and the electrical properties of 4H-SiC Schottky diodes

    SciTech Connect

    Wang, Y.; Ali, G.N.; Mikhov, M.K.; Vaidyanathan, V.; Skromme, B.J.; Raghothamachar, B.; Dudley, M.

    2005-01-01

    Defects in SiC degrade the electrical properties and yield of devices made from this material. This article examines morphological defects in 4H-SiC and defects visible in electron beam-induced current (EBIC) images and their effects on the electrical characteristics of Schottky diodes. Optical Nomarski microscopy and atomic force microscopy were used to observe the morphological defects, which are classified into 26 types based on appearance alone. Forward and reverse current-voltage characteristics were used to extract barrier heights, ideality factors, and breakdown voltages. Barrier heights decrease about linearly with increasing ideality factor, which is explained by discrete patches of low barrier height within the main contact. Barrier height, ideality, and breakdown voltage all degrade with increasing device diameter, suggesting that discrete defects are responsible. Electroluminescence was observed under reverse bias from microplasmas associated with defects containing micropipes. EBIC measurements reveal several types of features corresponding to recombination centers. The density of dark spots observed by EBIC correlates strongly with ideality factor and barrier height. Most morphological defects do not affect the reverse characteristics when no micropipes are present, but lower the barrier height and worsen the ideality factor. However, certain multiple-tailed defects, irregularly shaped defects and triangular defects with 3C inclusions substantially degrade both breakdown voltage and barrier height, and account for most of the bad devices that do not contain micropipes. Micropipes in these wafers are also frequently found to be of Type II, which do not run parallel to the c axis.

  5. The effect of gamma irradiation on electrical and dielectric properties of organic-based Schottky barrier diodes (SBDs) at room temperature

    NASA Astrophysics Data System (ADS)

    Uslu, Habibe; Yıldırım, Mert; Altındal, Şemsettin; Durmuş, Perihan

    2012-04-01

    The effect of 60Co (γ-ray) irradiation on the electrical and dielectric properties of Au/Polyvinyl Alcohol (Ni,Zn-doped)/n-Si Schottky barrier diodes (SBDs) has been investigated by using capacitance-voltage (C-V) and conductance-voltage (G/ω-V) measurements at room temperature and 1 MHz. The real capacitance and conductance values were obtained by eliminating series resistance (Rs) effect in the measured capacitance (Cm) and conductance (Gm) values through correction. The experimental values of the dielectric constant (ɛ'), dielectric loss (ɛ″), loss tangent (tanδ), ac electrical conductivity (σac) and the real (M') and imaginary (M″) parts of the electrical modulus were found to be strong functions of radiation and applied bias voltage, especially in the depletion and accumulation regions. In addition, the density distribution of interface states (Nss) profile was obtained using the high-low frequency capacitance (CHF-CLF) method for before and after irradiation. The Nss-V plots give two distinct peaks for both cases, namely before radiation and after radiation, and those peaks correspond to two different localized interface states regions at M/S interface. The changes in the dielectric properties in the depletion and accumulation regions stem especially from the restructuring and reordering of the charges at interface states and surface polarization whereas those in the accumulation region are caused by series resistance effect.

  6. Optical pumping of deep traps in AlGaN/GaN-on-Si HEMTs using an on-chip Schottky-on-heterojunction light-emitting diode

    SciTech Connect

    Li, Baikui; Tang, Xi; Chen, Kevin J.

    2015-03-02

    In this work, by using an on-chip integrated Schottky-on-heterojunction light-emitting diode (SoH-LED) which is seamlessly integrated with the AlGaN/GaN high electron mobility transistor (HEMT), we studied the effect of on-chip light illumination on the de-trapping processes of electrons from both surface and bulk traps. Surface trapping was generated by applying OFF-state drain bias stress, while bulk trapping was generated by applying positive substrate bias stress. The de-trapping processes of surface and/or bulk traps were monitored by measuring the recovery of dynamic on-resistance R{sub on} and/or threshold voltage V{sub th} of the HEMT. The results show that the recovery processes of both dynamic R{sub on} and threshold voltage V{sub th} of the HEMT can be accelerated by the on-chip SoH-LED light illumination, demonstrating the potentiality of on-chip hybrid opto-HEMTs to minimize the influences of traps during dynamic operation of AlGaN/GaN power HEMTs.

  7. Low-Temperature Growth of Well-Aligned ZnO Nanorod Arrays by Chemical Bath Deposition for Schottky Diode Application

    NASA Astrophysics Data System (ADS)

    Yuan, Zhaolin

    2015-04-01

    A well-aligned ZnO nanorod array (ZNRA) was successfully grown on an indium tin oxide (ITO) substrate by chemical bath deposition at low temperature. The morphology, crystalline structure, transmittance spectrum and photoluminescence spectrum of as-grown ZNRA were investigated by field emission scanning electron microscopy, x-ray diffraction, ultraviolet-visible spectroscopy and spectrophotometer, respectively. The results of these measurements showed that the ZNRA contained densely packed, aligned nanorods with diameters from 30 nm to 40 nm and a wurtzite structure. The ZNRA exhibited good optical transparency within the visible spectral range, with >80% transmission. Gold (Au) was deposited on top of the ZNRA, and the current-voltage characteristics of the resulting ITO/ZNRA/Au device in the dark were evaluated in detail. The ITO/ZNRA/Au device acted as a Schottky barrier diode with rectifying behaviour, low turn-on voltage (0.6 V), small reverse-bias saturation current (3.73 × 10-6 A), a high ideality factor (3.75), and a reasonable barrier height (0.65 V) between the ZNRA and Au.

  8. A theoretical model for Schottky diodes for excluding the sneak current in cross bar array resistive memory.

    PubMed

    Kim, Gun Hwan; Kim, Kyung Min; Seok, Jun Yeong; Lee, Hyun Ju; Cho, Deok-Yong; Han, Jeong Hwan; Hwang, Cheol Seong

    2010-09-24

    Kirchhoff's law was used to examine the electrical specifications of selection diodes, which are essential for suppressing the read interference problems in nano-scale resistive switching cross bar arrays with a high block density. The diode in the cross bar array with a 100 Mb block density should have a reverse/forward resistance ratio of > 10(8), and a forward current density of > 10(5) A cm(-2) for stable reading and writing operation. Whilst normal circuit simulators are heavily overloaded when the number of cells (m) connected to one bit and word line is larger (m > 100), which is the desired range for high density cross bar arrays, the present model can provide a simple simulation. The validity of this new method was confirmed by a comparison with the previously reported method based on a voltage estimation. PMID:20739739

  9. Response of Ni/4H-SiC Schottky barrier diodes to alpha-particle irradiation at different fluences

    NASA Astrophysics Data System (ADS)

    Omotoso, E.; Meyer, W. E.; Auret, F. D.; Diale, M.; Ngoepe, P. N. M.

    2016-01-01

    Irradiation experiments have been carried out on 1.9×1016 cm-3 nitrogen-doped 4H-SiC at room temperature using 5.4 MeV alpha-particle irradiation over a fluence ranges from 2.6×1010 to 9.2×1011 cm-2. Current-voltage (I-V), capacitance-voltage (C-V) and deep level transient spectroscopy (DLTS) measurements have been carried out to study the change in characteristics of the devices and free carrier removal rate due to alpha-particle irradiation, respectively. As radiation fluence increases, the ideality factors increased from 1.20 to 1.85 but the Schottky barrier height (SBHI-V) decreased from 1.47 to 1.34 eV. Free carrier concentration, Nd decreased with increasing fluence from 1.7×1016 to 1.1×1016 cm-2 at approximately 0.70 μm depth. The reduction in Nd shows that defects were induced during the irradiation and have effect on compensating the free carrier. The free carrier removal rate was estimated to be 6480±70 cm-1. Alpha-particle irradiation introduced two electron traps (E0.39 and E0.62), with activation energies of 0.39±0.03 eV and 0.62±0.08 eV, respectively. The E0.39 as attribute related to silicon or carbon vacancy, while the E0.62 has the attribute of Z1/Z2.

  10. Calculation of the electronic parameters of an Al/DNA/p-Si Schottky barrier diode influenced by alpha radiation.

    PubMed

    Al-Ta'ii, Hassan Maktuff Jaber; Mohd Amin, Yusoff; Periasamy, Vengadesh

    2015-01-01

    Many types of materials such as inorganic semiconductors have been employed as detectors for nuclear radiation, the importance of which has increased significantly due to recent nuclear catastrophes. Despite the many advantages of this type of materials, the ability to measure direct cellular or biological responses to radiation might improve detector sensitivity. In this context, semiconducting organic materials such as deoxyribonucleic acid or DNA have been studied in recent years. This was established by studying the varying electronic properties of DNA-metal or semiconductor junctions when exposed to radiation. In this work, we investigated the electronics of aluminium (Al)/DNA/silicon (Si) rectifying junctions using their current-voltage (I-V) characteristics when exposed to alpha radiation. Diode parameters such as ideality factor, barrier height and series resistance were determined for different irradiation times. The observed results show significant changes with exposure time or total dosage received. An increased deviation from ideal diode conditions (7.2 to 18.0) was observed when they were bombarded with alpha particles for up to 40 min. Using the conventional technique, barrier height values were observed to generally increase after 2, 6, 10, 20 and 30 min of radiation. The same trend was seen in the values of the series resistance (0.5889-1.423 Ω for 2-8 min). These changes in the electronic properties of the DNA/Si junctions could therefore be utilized in the construction of sensitive alpha particle detectors. PMID:25730484