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1
Focused ion beam source method and apparatus
2000-01-01

A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud ...

DOEpatents

2
Focused Ion beam source method and Apparatus
1998-08-17

A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud ...

DOE Information Bridge

3
Intense ion beam characterization and thermal modeling for beam materials processing
1994-08-01

The authors have developed an intense ion beam to investigate materials processing applications. Initial experiments have focused on thin film formation by depositing beam-ablated target material on substrates. Measurements of beam properties governing target ablation are presented here. Techniques include Thomson ...

DOE Information Bridge

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