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Sample records for circuit test generation

  1. Delay test generation for synchronous sequential circuits

    NASA Astrophysics Data System (ADS)

    Devadas, Srinivas

    1989-05-01

    We address the problem of generating tests for delay faults in non-scan synchronous sequential circuits. Delay test generation for sequential circuits is a considerably more difficult problem than delay testing of combinational circuits and has received much less attention. In this paper, we present a method for generating test sequences to detect delay faults in sequential circuits using the stuck-at fault sequential test generator STALLION. The method is complete in that it will generate a delay test sequence for a targeted fault given sufficient CPU time, if such a sequence exists. We term faults for which no delay test sequence exists, under out test methodology, sequentially delay redundant. We describe means of eliminating sequential delay redundancies in logic circuits. We present a partial-scan methodology for enhancing the testability of difficult-to-test of untestable sequential circuits, wherein a small number of flip-flops are selected and made controllable/observable. The selection process guarantees the elimination of all sequential delay redundancies. We show that an intimate relationship exists between state assignment and delay testability of a sequential machine. We describe a state assignment algorithm for the synthesis of sequential machines with maximal delay fault testability. Preliminary experimental results using the test generation, partial-scan and synthesis algorithm are presented.

  2. Generating circuit tests by exploiting designed behavior

    NASA Astrophysics Data System (ADS)

    Shirley, Mark H.

    1988-12-01

    Generating tests for sequential devices is one of the hardest problems in designing and manufacturing digital circuits. This task is difficult primarily because internal components are accessible only indirectly, forcing a test generator to use the surrounding components collectively as a probe for detecting faults. This in turn forces the test generator to reason about complex interactions between the behaviors of these surrounding components. Current automated solutions are becoming ineffective as designs grow larger and more complex. Yet, despite the complexity, human experts remain remarkably successful, in part, because they use knowledge from many sources and use a variety of reasoning techniques. This thesis exploits several kinds of expert knowledge about circuits and test generation not used by the current algorithms. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently for sequential circuits that provide few operations at their interfaces by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are a more readable and compact representation for tests than vectors are. Test programs can be constructed automatically by merging test program fragments using expert supplied goal-refined rules and domain independent planning techniques from artificial intelligence.

  3. Test generation for highly sequential circuits

    NASA Astrophysics Data System (ADS)

    Ghosh, Abhijit; Devadas, Srinivas; Newton, A. Richard

    1989-08-01

    We address the problem of generating test sequences for stuck-at faults in non-scan synchronous sequential circuits. We present a novel test procedure that exploits both the structure of the combinational logic in the circuit as well as the sequential behavior of the circuit. In contrast to previous approaches, we decompose the problem of sequential test generation into three subproblems of combinational test generation, fault-free state justification and fault-free state differentiation. We describe fast algorithms for state justification and state differentiation using the ON-sets and OFF-sets of flip-flop inputs and primary outputs. The decomposition of the testing problems into three subproblems rather than the traditional two, performing the justification and differentiation steps on the fault free rather than the faulty machine and the use of efficient techniques for cube intersection results in significant performance improvements over previous approaches.

  4. Test signal generation for analog circuits

    NASA Astrophysics Data System (ADS)

    Burdiek, B.; Mathis, W.

    2003-05-01

    In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation problem of finding optimal test stimuli detecting all faults form the fault set is formulated as an optimal control problem. The solution of the optimal control problem representing the test stimuli is computed using an optimization procedure. The optimization procedure is based on the necessary conditions for optimality like the maximum principle of Pontryagin and adjoint circuit equations.

  5. A hierarchical approach to test generation for CMOS VLSI circuits

    NASA Astrophysics Data System (ADS)

    Weening, Edward Christiaan

    A hierarchical approach to the automatic test pattern generation for large digital VLSI circuits, fabricated in CMOS technology, is developed and implemented. The use of information on the circuit's hierarchy, which is readily available from most modern CAD (Computer Aided Design) systems, speeds up the test generation process considerably and enhances the quality of the tests generated. The hierarchical test generation tool can also be integrated in future CAD systems making test generation and testability enhancement during circuit design feasible. The hierarchical approach is described at the switch, functional, and behavioral level. A test pattern generation algorithm at the switch level is presented. Test generation and fault simulation algorithms both using OBDD (Ordered Binary Decision Diagram) functional descriptions of the circuit modules are presented. A test plan generation method at the behavioral level is presented. Practical results show that the hierarchical approach to test generation is more efficient than a conventional, non-hierarchical approach, especially for switch level faults. The results also show that the use of Design For Testability (DFT) circuitry is supported at the behavioral level.

  6. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, Jr., Edward I.; Peterson, Kenneth A.; Barton, Daniel L.

    1998-01-01

    An electron beam apparatus and method for testing a circuit. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 .mu.m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits.

  7. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, E.I. Jr.; Peterson, K.A.; Barton, D.L.

    1998-07-14

    An electron beam apparatus and method for testing a circuit are disclosed. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 {micro}m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits. 7 figs.

  8. A Single Input Change Test Pattern Generator for Sequential Circuits

    NASA Astrophysics Data System (ADS)

    Liang, Feng; Lei, Shaochong; Shao, Zhibiao

    An optimized Built-In Self-Test technology is proposed in this paper. A simplified algebraic model is developed to represent the configurations of single input change circuits. A novel single input change sequence generation technique is designed. It consists of a modified scan shift register, a seed storage array and a series of XOR gates. This circuitry can automatically generate single input change sequences of more unique vectors. Experimental results based on the ISCAS-89 benchmark show that the proposed method can achieve high stuck-at fault coverage with low switching activity during test applications.

  9. Functional test generation for digital circuits described with a declarative language: LUSTRE

    NASA Astrophysics Data System (ADS)

    Almahrous, Mazen

    1990-08-01

    A functional approach to the test generation problem starting from a high level description is proposed. The circuit tested is modeled, using the LUSTRE high level data flow description language. The different LUSTRE primitives are translated to a SATAN format graph in order to evaluate the testability of the circuit and to generate test sequences. Another method of testing the complex circuits comprising an operative part and a control part is defined. It consists of checking experiments for the control part observed through the operative part. It was applied to the automata generated from a LUSTRE description of the circuit.

  10. Integrated circuit test-port architecture and method and apparatus of test-port generation

    DOEpatents

    Teifel, John

    2016-04-12

    A method and apparatus are provided for generating RTL code for a test-port interface of an integrated circuit. In an embodiment, a test-port table is provided as input data. A computer automatically parses the test-port table into data structures and analyzes it to determine input, output, local, and output-enable port names. The computer generates address-detect and test-enable logic constructed from combinational functions. The computer generates one-hot multiplexer logic for at least some of the output ports. The one-hot multiplexer logic for each port is generated so as to enable the port to toggle between data signals and test signals. The computer then completes the generation of the RTL code.

  11. Automatic test pattern generation for logic circuits using the Boolean tree

    SciTech Connect

    Jeong Taegwon.

    1991-01-01

    The goal of this study was to develop an algorithm that can generate test patterns for combinational circuits and sequential logic circuits automatically. The new proposed algorithm generates a test pattern by using a special tree called a modified Boolean tree. In this algorithm, the construction of a modified Boolean tree is the most time-consuming step. Following the construction of a modified Boolean tree, a test pattern can be found by simply assigning a logic value 1 for even primary inputs and a logic value 0 for odd primary inputs of the constructed modified Boolean tree. The algorithm is applied to several benchmark circuits. The results showed the following: (1) for combinational circuits, the algorithm can generate test patterns 10-15% faster than the FAN algorithm, which is known as one of the most efficient algorithms to-date; (2) for sequential circuits, the algorithm shows more fault coverage than the nine valued algorithm.

  12. Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

    PubMed Central

    Zhou, Jingyu; Tian, Shulin; Yang, Chenglin; Ren, Xuelong

    2014-01-01

    This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output responses of the DUT for fault classification and detection. The novel ELM-based test generation algorithm proposed in this paper contains mainly three aspects of innovation. Firstly, this algorithm saves time efficiently by classifying response space with ELM. Secondly, this algorithm can avoid reduced test precision efficiently in case of reduction of the number of impulse-response samples. Thirdly, a new process of test signal generator and a test structure in test generation algorithm are presented, and both of them are very simple. Finally, the abovementioned improvement and functioning are confirmed in experiments. PMID:25610458

  13. Test generation algorithm for fault detection of analog circuits based on extreme learning machine.

    PubMed

    Zhou, Jingyu; Tian, Shulin; Yang, Chenglin; Ren, Xuelong

    2014-01-01

    This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output responses of the DUT for fault classification and detection. The novel ELM-based test generation algorithm proposed in this paper contains mainly three aspects of innovation. Firstly, this algorithm saves time efficiently by classifying response space with ELM. Secondly, this algorithm can avoid reduced test precision efficiently in case of reduction of the number of impulse-response samples. Thirdly, a new process of test signal generator and a test structure in test generation algorithm are presented, and both of them are very simple. Finally, the abovementioned improvement and functioning are confirmed in experiments. PMID:25610458

  14. Photoconductive circuit element pulse generator

    DOEpatents

    Rauscher, Christen

    1989-01-01

    A pulse generator for characterizing semiconductor devices at millimeter wavelength frequencies where a photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test.

  15. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1990-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  16. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1988-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  17. Designing Test Chips for Custom Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G.; Griswold, T. W.; Pina, C. A.; Timoc, C. C.

    1985-01-01

    Collection of design and testing procedures partly automates development of built-in test chips for CMOS integrated circuits. Testchip methodology intended especially for users of custom integratedcircuit wafers. Test-Chip Designs and Testing Procedures (including datareduction procedures) generated automatically by computer from programed design and testing rules and from information supplied by user.

  18. Chain Of Test Contacts For Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Lieneweg, Udo

    1989-01-01

    Test structure forms chain of "cross" contacts fabricated together with large-scale integrated circuits. If necessary, number of such chains incorporated at suitable locations in integrated-circuit wafer for determination of fabrication yield of contacts. In new structure, resistances of individual contacts determined: In addition to making it possible to identify local defects, enables generation of statistical distributions of contact resistances for prediction of "parametric" contact yield of fabrication process.

  19. Integrated-Circuit Pseudorandom-Number Generator

    NASA Technical Reports Server (NTRS)

    Steelman, James E.; Beasley, Jeff; Aragon, Michael; Ramirez, Francisco; Summers, Kenneth L.; Knoebel, Arthur

    1992-01-01

    Integrated circuit produces 8-bit pseudorandom numbers from specified probability distribution, at rate of 10 MHz. Use of Boolean logic, circuit implements pseudorandom-number-generating algorithm. Circuit includes eight 12-bit pseudorandom-number generators, outputs are uniformly distributed. 8-bit pseudorandom numbers satisfying specified nonuniform probability distribution are generated by processing uniformly distributed outputs of eight 12-bit pseudorandom-number generators through "pipeline" of D flip-flops, comparators, and memories implementing conditional probabilities on zeros and ones.

  20. Automatic Parametric Testing Of Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Jennings, Glenn A.; Pina, Cesar A.

    1989-01-01

    Computer program for parametric testing saves time and effort in research and development of integrated circuits. Software system automatically assembles various types of test structures and lays them out on silicon chip, generates sequency of test instructions, and interprets test data. Employs self-programming software; needs minimum of human intervention. Adapted to needs of different laboratories and readily accommodates new test structures. Program codes designed to be adaptable to most computers and test equipment now in use. Written in high-level languages to enhance transportability.

  1. Electronic test and calibration circuits, a compilation

    NASA Technical Reports Server (NTRS)

    1972-01-01

    A wide variety of simple test calibration circuits are compiled for the engineer and laboratory technician. The majority of circuits were found inexpensive to assemble. Testing electronic devices and components, instrument and system test, calibration and reference circuits, and simple test procedures are presented.

  2. Submicrosecond Power-Switching Test Circuit

    NASA Technical Reports Server (NTRS)

    Folk, Eric N.

    2006-01-01

    A circuit that changes an electrical load in a switching time shorter than 0.3 microsecond has been devised. This circuit can be used in testing the regulation characteristics of power-supply circuits . especially switching power-converter circuits that are supposed to be able to provide acceptably high degrees of regulation in response to rapid load transients. The combination of this power-switching circuit and a known passive constant load could be an attractive alternative to a typical commercially available load-bank circuit that can be made to operate in nominal constant-voltage, constant-current, and constant-resistance modes. The switching provided by a typical commercial load-bank circuit in the constant-resistance mode is not fast enough for testing of regulation in response to load transients. Moreover, some test engineers do not trust the test results obtained when using commercial load-bank circuits because the dynamic responses of those circuits are, variously, partly unknown and/or excessively complex. In contrast, the combination of this circuit and a passive constant load offers both rapid switching and known (or at least better known) load dynamics. The power-switching circuit (see figure) includes a signal-input section, a wide-hysteresis Schmitt trigger that prevents false triggering in the event of switch-contact bounce, a dual-bipolar-transistor power stage that drives the gate of a metal oxide semiconductor field-effect transistor (MOSFET), and the MOSFET, which is the output device that performs the switching of the load. The MOSFET in the specific version of the circuit shown in the figure is rated to stand off a potential of 100 V in the "off" state and to pass a current of 20 A in the "on" state. The switching time of this circuit (the characteristic time of rise or fall of the potential at the drain of the MOSFET) is .300 ns. The circuit can accept any of three control inputs . which one depending on the test that one seeks to perform: a

  3. Conductive surge testing of circuits and systems

    NASA Technical Reports Server (NTRS)

    Richman, P.

    1980-01-01

    Techniques are given for conductive surge testing of powered electronic equipment. The correct definitions of common and normal mode are presented. Testing requires not only spike-surge generators with a suitable range of open-circuit voltage and short-circuit current waveshapes, but also appropriate means, termed couplers, for connecting test surges to the equipment under test. Key among coupler design considerations is minimization of fail positives resulting from reduction in delivered surge energy due to the coupler. Back-filters and the lines on which they are necessary, are considered as well as ground-fault and ground potential rise. A method for monitoring delivered and resulting surge waves is mentioned.

  4. BLOCKING OSCILLATOR DOUBLE PULSE GENERATOR CIRCUIT

    DOEpatents

    Haase, J.A.

    1961-01-24

    A double-pulse generator, particuiarly a double-pulse generator comprising a blocking oscillator utilizing a feedback circuit to provide means for producing a second pulse within the recovery time of the blocking oscillator, is described. The invention utilized a passive network which permits adjustment of the spacing between the original pulses derived from the blocking oscillator and further utilizes the original pulses to trigger a circuit from which other pulses are initiated. These other pulses are delayed and then applied to the input of the blocking oscillator, with the result that the output from the oscillator circuit contains twice the number of pulses originally initiated by the blocking oscillator itself.

  5. Intersecting Circuits Generate Precisely Patterned Retinal Waves

    PubMed Central

    Akrouh, Alejandro; Kerschensteiner, Daniel

    2013-01-01

    SUMMARY The developing retina generates spontaneous glutamatergic (stage III) waves of activity that sequentially recruit neighboring ganglion cells with opposite light responses (ON and OFF RGCs). This activity pattern is thought to help establish parallel ON and OFF pathways in downstream visual areas. The circuits that produce stage III waves and desynchronize ON and OFF RGC firing remain obscure. Using dual patch clamp recordings, we find that ON and OFF RGCs receive sequential excitatory input from ON and OFF cone bipolar cells (CBCs), respectively. This input sequence is generated by crossover circuits, in which ON CBCs control glutamate release from OFF CBCs via diffusely stratified inhibitory amacrine cells. In addition, neighboring ON CBCs communicate directly and indirectly through lateral glutamatergic transmission and gap junctions, both of which are required for wave initiation and propagation. Thus, intersecting lateral excitatory and vertical inhibitory circuits give rise to precisely patterned stage III retinal waves. PMID:23830830

  6. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing... series or the resistance of multiple balanced series to be connected in parallel prior to...

  7. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing... series or the resistance of multiple balanced series to be connected in parallel prior to...

  8. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing... series or the resistance of multiple balanced series to be connected in parallel prior to...

  9. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing... series or the resistance of multiple balanced series to be connected in parallel prior to...

  10. A power semiconductor test circuit with reduced power requirements

    NASA Technical Reports Server (NTRS)

    Been, J. F.

    1970-01-01

    Switching circuit utilizing silicon controlled rectifier reduces input power requirements normally associated with testing power semiconductors in an operational type mode. Circuit alleviates problems of inaccessibility, lack of large amounts of power, physical size of power resistors, wiring, and heat generation.

  11. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument... parallel prior to their connection to the blasting line; (3) Continuity of blasting lines prior to...

  12. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument... parallel prior to their connection to the blasting line; (3) Continuity of blasting lines prior to...

  13. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument... parallel prior to their connection to the blasting line; (3) Continuity of blasting lines prior to...

  14. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 56.6407 Section 56.6407 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Explosives Electric Blasting § 56.6407 Circuit testing. A...

  15. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument... parallel prior to their connection to the blasting line; (3) Continuity of blasting lines prior to...

  16. Memristive Sisyphus circuit for clock signal generation

    PubMed Central

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-01-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets. PMID:27199243

  17. Memristive Sisyphus circuit for clock signal generation.

    PubMed

    Pershin, Yuriy V; Shevchenko, Sergey N; Nori, Franco

    2016-01-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as "dripping ants" or drops from leaky faucets. PMID:27199243

  18. Memristive Sisyphus circuit for clock signal generation

    NASA Astrophysics Data System (ADS)

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-05-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets.

  19. Periodic binary sequence generators: VLSI circuits considerations

    NASA Technical Reports Server (NTRS)

    Perlman, M.

    1984-01-01

    Feedback shift registers are efficient periodic binary sequence generators. Polynomials of degree r over a Galois field characteristic 2(GF(2)) characterize the behavior of shift registers with linear logic feedback. The algorithmic determination of the trinomial of lowest degree, when it exists, that contains a given irreducible polynomial over GF(2) as a factor is presented. This corresponds to embedding the behavior of an r-stage shift register with linear logic feedback into that of an n-stage shift register with a single two-input modulo 2 summer (i.e., Exclusive-OR gate) in its feedback. This leads to Very Large Scale Integrated (VLSI) circuit architecture of maximal regularity (i.e., identical cells) with intercell communications serialized to a maximal degree.

  20. Lithium Circuit Test Section Design and Fabrication

    SciTech Connect

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-20

    The Early Flight Fission -- Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  1. Flip-flop resolving time test circuit

    NASA Technical Reports Server (NTRS)

    Rosenberger, F.; Chaney, T. J.

    1982-01-01

    Integrated circuit (IC) flip-flop resolving time parameters are measured by wafer probing, without need of dicing or bonding, throught the incorporation of test structures on an IC together with the flip-flop to be measured. Several delays that are fabricated as part of the test circuit, including a voltage-controlled delay with a resolution of a few picosecs, are calibrated as part of the test procedure by integrating them into, and out of, the delay path of a ring oscillator. Each of the delay values is calculated by subtracting the period of the ring oscillator with the delay omitted from the period with the delay included. The delay measurement technique is sufficiently general for other applications. The technique is illustrated for the case of the flip-flop parameters of a 5-micron feature size NMOS circuit.

  2. Lithium Circuit Test Section Design and Fabrication

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas; Garber, Anne

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper will discuss the overall system design and build and the component testing findings.

  3. Lithium Circuit Test Section Design and Fabrication

    NASA Astrophysics Data System (ADS)

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  4. Test Structures For Bumpy Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.; Sayah, Hoshyar R.

    1989-01-01

    Cross-bridge resistors added to comb and serpentine patterns. Improved combination of test structures built into integrated circuit used to evaluate design rules, fabrication processes, and quality of interconnections. Consist of meshing serpentines and combs, and cross bridge. Structures used to make electrical measurements revealing defects in design or fabrication. Combination of test structures includes three comb arrays, two serpentine arrays, and cross bridge. Made of aluminum or polycrystalline silicon, depending on material in integrated-circuit layers evaluated. Aluminum combs and serpentine arrays deposited over steps made by polycrystalline silicon and diffusion layers, while polycrystalline silicon versions of these structures used to cross over steps made by thick oxide layer.

  5. Automatic generation of signal processing integrated circuits

    SciTech Connect

    Pope, S.P.

    1985-01-01

    A system for the automated design of signal processing integrated circuits is described in this thesis. The system is based on a library of circuit cells, and a software package that can configure the cells into complete integrated circuits. The architecture of the cell library is optimized for low and medium bandwidth digital signal processing applications. Circuits designed with the system use a multiprocessor architecture. Input to the system is a design file written in a specialized programming language. Software emulation from the design file is used to verify performance. A two-pass silicon compiler is used to translate the design file into a mask-level description of an integrated circuit. A major goal of the project is to make the system useable by those with little or no formal training in integrated circuits. A second goal is to reduce the time and cost associated with performing an integrated circuit design, while still producing designs which are reasonably efficient in their use of the technology. Development of the system was guided by basic research on appropriate architectures and circuit constructs for signal processors. As part of this research an integrated circuit was designed which performs speech analysis and synthesis. This vocoder circuit is intended for use in low-bit-rate digital speech transmission systems.

  6. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 57.6407 Section 57.6407 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Explosives Electric Blasting-Surface and Underground § 57.6407...

  7. Testing of the anemometer circuit: Data report

    NASA Technical Reports Server (NTRS)

    Moen, Michael J.

    1992-01-01

    The following text discusses results from the electronic step testing and the beginning of velocity step testing in the shock tube. It should be kept in mind that frequency response is always measured as the time from the beginning of the event to the minimum (positive inflection) of the 'bucket' that immediately follows the response. This report is not a complete account of the results from square wave testing. Some data is still in the process of being analyzed and efforts are being made to fit the data to both Freymuth's third order theory and modelled responses from SPICE circuit simulation software.

  8. Integral testing of relays and circuit breakers

    SciTech Connect

    Bandyopadhyay, K.K.

    1993-12-31

    Among all equipment types considered for seismic qualification, relays have been most extensively studied through testing due to a wide variation of their designs and seismic capacities. A temporary electrical discontinuity or ``chatter`` is the common concern for relays. A chatter duration of 2 milliseconds is typically used as an acceptance criterion to determine the seismic capability of a relay. Many electrical devices, on the other hand, receiving input signals from relays can safely tolerate a chatter level much greater than 2 ms. In Phase I of a test program, Brookhaven National Laboratory performed testing of many relay models using the 2-ms chatter criterion. In Phase II of the program, the factors influencing the relay chatter criterion, and impacts of relay chatter on medium and low voltage circuit breakers and lockout relays were investigated. This paper briefly describes the Phase II tests and presents the important observations.

  9. FRONTAL VIEW OF #3 GENERATOR, 6600 VOLT OIL CIRCUIT BREAKER, ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    FRONTAL VIEW OF #3 GENERATOR, 6600 VOLT OIL CIRCUIT BREAKER, LOCATED BEHIND SLATE SWITCHBOARD. PHOTO BY JET LOWE, HAER, 1995. - Elwha River Hydroelectric System, Elwha Hydroelectric Dam & Plant, Port Angeles, Clallam County, WA

  10. Entangled Coherent States Generation in two Superconducting LC Circuits

    SciTech Connect

    Chen Meiyu; Zhang Weimin

    2008-11-07

    We proposed a novel pure electronic (solid state) device consisting of two superconducting LC circuits coupled to a superconducting flux qubit. The entangled coherent states of the two LC modes is generated through the measurement of the flux qubit states. The interaction of the flux qubit and two LC circuits is controlled by the external microwave control lines. The geometrical structure of the LC circuits is adjustable and makes a strong coupling between them achievable. This entangled coherent state generator can be realized by using the conventional microelectronic fabrication techniques which increases the feasibility of the experiment.

  11. Synthesizing genetic sequential logic circuit with clock pulse generator

    PubMed Central

    2014-01-01

    Background Rhythmic clock widely occurs in biological systems which controls several aspects of cell physiology. For the different cell types, it is supplied with various rhythmic frequencies. How to synthesize a specific clock signal is a preliminary but a necessary step to further development of a biological computer in the future. Results This paper presents a genetic sequential logic circuit with a clock pulse generator based on a synthesized genetic oscillator, which generates a consecutive clock signal whose frequency is an inverse integer multiple to that of the genetic oscillator. An analogous electronic waveform-shaping circuit is constructed by a series of genetic buffers to shape logic high/low levels of an oscillation input in a basic sinusoidal cycle and generate a pulse-width-modulated (PWM) output with various duty cycles. By controlling the threshold level of the genetic buffer, a genetic clock pulse signal with its frequency consistent to the genetic oscillator is synthesized. A synchronous genetic counter circuit based on the topology of the digital sequential logic circuit is triggered by the clock pulse to synthesize the clock signal with an inverse multiple frequency to the genetic oscillator. The function acts like a frequency divider in electronic circuits which plays a key role in the sequential logic circuit with specific operational frequency. Conclusions A cascaded genetic logic circuit generating clock pulse signals is proposed. Based on analogous implement of digital sequential logic circuits, genetic sequential logic circuits can be constructed by the proposed approach to generate various clock signals from an oscillation signal. PMID:24884665

  12. Creative Test Generators

    ERIC Educational Resources Information Center

    Vickers, F. D.

    1973-01-01

    A brief description of a test generating program which generates questions concerning the Fortran programming language in a random but guided fashion and without resorting to an item bank.'' (Author/AK)

  13. Starter/generator testing

    NASA Astrophysics Data System (ADS)

    Anon

    1994-10-01

    Sundstrand Aerospace and GE Aircraft Engines have studied the switched reluctance machine for use as an integral starter/generator for future aircraft engines. They have conducted an initial, low-power testing of the starter/generator, which is based on power inverters using IGBT-technology semiconductors, to verify its feasibility in the externally mounted version of the integral starter/generator. This preliminary testing of the 250-kW starter/generator reveals favorable results.

  14. Fastrac Gas Generator Testing

    NASA Technical Reports Server (NTRS)

    Nesman, Tomas E.; Dennis, Jay

    1999-01-01

    A rocket engine gas generator component development test was recently conducted at the Marshall Space Flight Center. This gas generator was intended to power a rocket engine turbopump by the combustion of Lox and RP-1. The testing demonstrated design requirements for start sequence, wall compatibility, performance, and stable combustion. During testing the gas generator injector was modified to improve distribution of outer wall coolant and the igniter boss was modified to investigate the use of a pyrotechnic igniter, Expected chamber pressure oscillations at longitudinal acoustic modes were measured for three different chamber lengths tested. High amplitude discrete oscillations occurred in the chamber-alone configurations when chamber acoustic modes coupled with feed-system acoustics modes. For the full gas generator configuration, which included the turbine inlet manifold simulator, high amplitude oscillations occurred only at off-design very low power levels. This testing led to a successful gas generator design for the Fastrac 60,000 lb thrust engine.

  15. Fastrac Gas Generator Testing

    NASA Technical Reports Server (NTRS)

    Nesman, Tomas E.; Dennis, Jay

    2001-01-01

    A rocket engine gas generator component development test was recently conducted at the Marshall Space Flight Center. This gas generator is intended to power a rocket engine turbopump by the combustion of Lox and RP-1. The testing demonstrated design requirements for start sequence, wall compatibility, performance, and stable combustion. During testing the gas generator injector was modified to improve distribution of outer wall coolant and the igniter boss was modified to investigate the use of a pyrotechnic igniter. Expected chamber pressure oscillations at longitudinal acoustic mode were measured for three different chamber lengths tested. High amplitude discrete oscillations resulted in the chamber-alone configurations when chamber acoustic modes coupled with feed-system acoustics modes. For the full gas generator configuration, which included a turbine inlet manifold, high amplitude oscillations occurred only at off-design very low power levels. This testing led to a successful gas generator design for the Fastrac 60,000 lb thrust engine.

  16. Development of a circuit breaker for large generators. Final report

    SciTech Connect

    Garzon, R.D.; Wu, J.L.

    1982-01-01

    This report deals with the evaluation of design concepts for the development of Circuit Breakers for large generators and attempts to define a rating structure for a generator circuit breaker. It includes studies on the influence of the system upon the performance of the circuit breaker. This study covers: The harmonic content in the fault current, the absence of current zeros, the influence of the dynamics of the generator shaft upon the current, and the magnitude and characteristics of the inherent transient recovery voltage produced by the system. Design requirements such as storage volumes, operating pressures and size of nozzle's orifice are identified for SF/sub 6/ synchronous and non synchronous interrupters of the axial flow type. The concept of a current limiting generator circuit breaker is introduced and two variations of a current limiting element are evaluated. One of the concepts uses liquid metal (NaK 78) as the current limiting element, and the other considers the use of a frangible conductor. The preliminary results obtained with an experimental model of a NaK device shows that a magnetic pinching effect reduces the time required for the initiation of the liquid metal vaporization which determines the onset of current limitation and shows that the NaK device appears to offer promise for the development of a current limiting generator breaker.

  17. Reduced circuit implementation of encoder and syndrome generator

    SciTech Connect

    Trager, Barry M; Winograd, Shmuel

    2014-05-27

    An error correction method and system includes an Encoder and Syndrome-generator that operate in parallel to reduce the amount of circuitry used to compute check symbols and syndromes for error correcting codes. The system and method computes the contributions to the syndromes and check symbols 1 bit at a time instead of 1 symbol at a time. As a result, the even syndromes can be computed as powers of the odd syndromes. Further, the system assigns symbol addresses so that there are, for an example GF(2.sup.8) which has 72 symbols, three (3) blocks of addresses which differ by a cube root of unity to allow the data symbols to be combined for reducing size and complexity of odd syndrome circuits. Further, the implementation circuit for generating check symbols is derived from syndrome circuit using the inverse of the part of the syndrome matrix for check locations.

  18. Test results for SEU and SEL immune memory circuits

    NASA Technical Reports Server (NTRS)

    Wiseman, D.; Canaris, J.; Whitaker, S.; Gambles, J.; Arave, K.; Arave, L.

    1993-01-01

    Test results for three SEU logic/circuit hardened CMOS memory circuits verify upset and latch-up immunity for two configurations to be in excess of 120 MeV cm(exp 2)/mg using a commercial, non-radiation hardened CMOS process. Test chips from three separate fabrication runs in two different process were evaluated.

  19. Calorimeter Preamplifier Hybrid Circuit Test Jig

    SciTech Connect

    Abraham, B.M.; /Fermilab

    1999-04-19

    There are two ways in which the testing may be initiated, remotely or locally. If the remote operation is desired, an external TTL level signal must be provided to the test jig with the remotellocal switch on the side of the test jig switched to remote. A logic high will initiate the test. A logic low will terminate the test. In the event that an external signal is connected to the test jig while local operation occurs, the local control takes precedence over remote control. Once a DVT has been locked in the ZIF socket and the DIP switches are selected, the Push-to-Test button may be depressed. Momentarily depressing the button will initiate a test with a minimum 400 ms duration. At the same time a PBCLOCK and PBLATCH pulses will be initiated and the power rails +12V, +8V, and -6V will be ramped to full voltage. The time at which the power rails reach the full voltage is about 13 ms and it is synchronized with bypass capacitors placed on COMP input of U20 and U22 and on the output of U23 voltage regulators. The voltage rails are supplied to a {+-}10% window comparator. A red LED indicates the rail is below or above 10% of the design value. A green LED indicates the rail is within acceptable limits. For DDT with a 5 pF and 10 pF feed back capacitor, the +12V and +8V rails are current-regulated to 19rnA and 22 rnA respectively and the -6V rail is short-circuit protected within the regulator. For DUT with a 22 pF feed back capacitor the current regulation is the same as above except that the +8V rail is current regulated to 43 rnA. The power rails are supplied to the DUT via a 10 {Omega} resistor. The voltage drop across this resistor is sensed by a differential amplifier AD620 and amplified by a gain of 10. An external BNC connection is provided from this point to allow for current measurements by the vendor. The current value for each rail is calculated by measuring the voltage value at this point and divided by (10*10{Omega}). The next stage inverts and amplifies

  20. Electrical short circuit and current overload tests on aircraft wiring

    NASA Technical Reports Server (NTRS)

    Cahill, Patricia

    1995-01-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  1. Short Circuit Current Contribution for Different Wind Turbine Generator Types

    SciTech Connect

    Muljadi, E.; Samaan, Nader A.; Gevorgian, Vahan; Li, Jun; Pasupulati, Subbaiah

    2010-09-28

    An important aspect of wind power plant (WPP) impact studies is to evaluate the short circuit (SC) current contribution of the plant into the transmission network under different fault conditions. This task can be challenging to protection engineers due to the topology differences between different types of wind turbine generators (WTGs) and the conventional generating units. This paper represents simulation results for short circuit current contribution for different types of WTGs obtained through transient analysis using generic WTG models. The obtained waveforms are analyzed to explain the behavior, such as peak values and rate of decay, of the WTG. The effect of fault types and location, and the effect of the control algorithms of power converters on SC current contribution are investigated. It is shown that the response of the WPP to faults will vary based on the type of the installed WTGs. While in Type 1 and Type 2 WTGs, short circuit current will be determined by the physical characteristics of the induction generator, the contribu-tion of Type 3 and Type 4 WTG will be mostly characterized by the power converters control algorithms which are usually considered proprietary information by the wind turbine manufacturers.

  2. Test and inspection for process control of monolithic circuits

    NASA Technical Reports Server (NTRS)

    Spangenberg, E.

    1967-01-01

    Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation.

  3. Addressable-Matrix Integrated-Circuit Test Structure

    NASA Technical Reports Server (NTRS)

    Sayah, Hoshyar R.; Buehler, Martin G.

    1991-01-01

    Method of quality control based on use of row- and column-addressable test structure speeds collection of data on widths of resistor lines and coverage of steps in integrated circuits. By use of straightforward mathematical model, line widths and step coverages deduced from measurements of electrical resistances in each of various combinations of lines, steps, and bridges addressable in test structure. Intended for use in evaluating processes and equipment used in manufacture of application-specific integrated circuits.

  4. Documentation of Stainless Steel Lithium Circuit Test Section Design

    NASA Technical Reports Server (NTRS)

    Godfroy, T. J.; Martin, J. J.; Stewart, E. T.; Rhys, N. O.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.

  5. Documentation of Stainless Steel Lithium Circuit Test Section Design. Suppl

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas J. (Compiler); Martin, James J.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations

  6. Elements configuration of the open lead test circuit

    NASA Astrophysics Data System (ADS)

    Fukuzaki, Yumi; Ono, Akira

    2016-07-01

    In the field of electronics, small electronic devices are widely utilized because they are easy to carry. The devices have various functions by user's request. Therefore, the lead's pitch or the ball's pitch have been narrowed and high-density printed circuit board has been used in the devices. Use of the ICs which have narrow lead pitch makes normal connection difficult. When logic circuits in the devices are fabricated with the state-of-the-art technology, some faults have occurred more frequently. It can be divided into types of open faults and short faults. We have proposed a new test method using a test circuit in the past. This paper propose elements configuration of the test circuit.

  7. Fiber-optic testing system having a detection circuit

    NASA Astrophysics Data System (ADS)

    Needham, Francis L.

    1992-05-01

    A system for testing a fiber-optic component with infrared radiation is provided. The testing system has a source of infrared radiation, an optic coupler, a detecting circuit, and an analog tape recorder. The optic coupler directs the infrared radiation onto the fiber-optic component. The detection circuit is electrically connected to the tape recorder. The detection circuit has an amplifier, a potentiometer connected in parallel to the amplifier, and a photoelectric transducer connected in series to the amplifier. These components are mounted on a non-conductive board. A power source supplies voltage and is connected to the amplifier. The circuit operates by having the photoelectric transducer sense the infrared radiation emitted from the tested fiber-optic component and convert the radiation into an electrical signal. The amplifier then amplifies the electrical signal to the voltage necessary for driving the tape recorder.

  8. Fiber-optical testing system having a detection circuit

    NASA Astrophysics Data System (ADS)

    Needham, Francis L.

    1994-01-01

    A system for testing a fiber-optic component with infrared radiation is provided. The testing system has a source of infrared radiation, an optic coupler, a detecting circuit, and an analog tape recorder. The optic coupler directs the infrared radiation onto the fiber-optic component. The detection circuit is electrically connected to the tape recorder. The detection circuit has an amplifier, a potentiometer connected in parallel to the amplifier, and a photoelectric transducer connected in series to the amplifier. These components are mounted on a non-conductive board. A power source supplies voltage and is connected to the amplifier. The circuit operates by having the photoelectric transducer sense the infrared radiation emitted from the tested fiber-optic component and convert the radiation into an electrical signal. The amplifier then amplifies the electrical signal to the voltage necessary for driving the tape recorder.

  9. Research on reliability test circuit of pneumatic pressure regulator

    NASA Astrophysics Data System (ADS)

    Ma, Jungong; Wang, Haitao; Oneyama, Naotake; Senoo, Mitsuru; Zhang, Huping

    2006-11-01

    In order to evaluate ISO/CD19973-4, some items had been tested, such as step response, valve opening, feasible opening frequency, air consumption, piping influence, cycle response and so on. The results show that Valve opening varies sensitively to the size of piping, solenoid valve and test chamber. The valve of regulator opens to some extent, closes immediately, and never reaches the full opening. If these circuit specifications are defined concretely and observed strictly, it is not impossible to obtain a certain required opening ratio and air consumption is very large. On the side, the compared tests based on the Japanese JIS test circuit having been carried out, the results show that, regardless of test circuit specifications, the valve of regulator always repeats full closing and full opening. The relief valve of the regulator operates too. At the same operating frequency, air consumption is one digit less than the one in ISO/CD 19973-4 circuit. In the end, improved JIS circuit was put forward as a reliability circuit of pneumatic pressure regulator.

  10. Generating Effective Models and Parameters for RNA Genetic Circuits.

    PubMed

    Hu, Chelsea Y; Varner, Jeffrey D; Lucks, Julius B

    2015-08-21

    RNA genetic circuitry is emerging as a powerful tool to control gene expression. However, little work has been done to create a theoretical foundation for RNA circuit design. A prerequisite to this is a quantitative modeling framework that accurately describes the dynamics of RNA circuits. In this work, we develop an ordinary differential equation model of transcriptional RNA genetic circuitry, using an RNA cascade as a test case. We show that parameter sensitivity analysis can be used to design a set of four simple experiments that can be performed in parallel using rapid cell-free transcription-translation (TX-TL) reactions to determine the 13 parameters of the model. The resulting model accurately recapitulates the dynamic behavior of the cascade, and can be easily extended to predict the function of new cascade variants that utilize new elements with limited additional characterization experiments. Interestingly, we show that inconsistencies between model predictions and experiments led to the model-guided discovery of a previously unknown maturation step required for RNA regulator function. We also determine circuit parameters in two different batches of TX-TL, and show that batch-to-batch variation can be attributed to differences in parameters that are directly related to the concentrations of core gene expression machinery. We anticipate the RNA circuit models developed here will inform the creation of computer aided genetic circuit design tools that can incorporate the growing number of RNA regulators, and that the parametrization method will find use in determining functional parameters of a broad array of natural and synthetic regulatory systems. PMID:26046393

  11. Circuit design considerations for regulating energy generated by dielectric elastomer generators

    NASA Astrophysics Data System (ADS)

    Lo, Ho Cheong; Mckay, Thomas; O'Brien, Benjamin M.; Calius, Emilio; Anderson, Iain

    2011-04-01

    Dielectric Elastomer Generator(s) (DEG) have many unique properties that give them advantages over conventional electromagnetic generators. These include the ability to effectively generate power from slow and irregular motions, low cost, relatively large energy density, and a soft and flexible nature. For DEG to generate usable electrical energy circuits for charging (or priming) the stretched DEG and regulating the generated energy when relaxed are required. Most prior art has focused on the priming challenge, and there is currently very little work into developing circuits that address design issues for extracting the electrical energy and converting it into a usable form such as low DC voltages (~10 V) for small batteries or AC mains voltage (~100 V). This paper provides a brief introduction to the problems of regulating the energy generated by DEG. A buck converter and a charge pump are common DC-DC step-down circuits and are used as case studies to explore the design issues inherent in converting the high voltage energy into a form suitable for charging a battery. Buck converters are efficient and reliable but also heavy and bulky, making them suitable for large scale power generation. The smaller and simpler charge pump, though a less effective energy harvester, is better for small and discrete power generation. Future development in miniature DE fabrication is expected to reduce the high operational voltages, simplifying the design of these circuits.

  12. RF Testing Of Microwave Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Romanofsky, R. R.; Ponchak, G. E.; Shalkhauser, K. A.; Bhasin, K. B.

    1988-01-01

    Fixtures and techniques are undergoing development. Four test fixtures and two advanced techniques developed in continuing efforts to improve RF characterization of MMIC's. Finline/waveguide test fixture developed to test submodules of 30-GHz monolithic receiver. Universal commercially-manufactured coaxial test fixture modified to enable characterization of various microwave solid-state devices in frequency range of 26.5 to 40 GHz. Probe/waveguide fixture is compact, simple, and designed for non destructive testing of large number of MMIC's. Nondestructive-testing fixture includes cosine-tapered ridge, to match impedance wavequide to microstrip. Advanced technique is microwave-wafer probing. Second advanced technique is electro-optical sampling.

  13. Extended life testing evaluation of complementary MOS integrated circuits

    NASA Technical Reports Server (NTRS)

    Brosnan, T. E.

    1972-01-01

    The purpose of the extended life testing evaluation of complementary MOS integrated circuits was twofold: (1) To ascertain the long life capability of complementary MOS devices. (2) To assess the objectivity and reliability of various accelerated life test methods as an indication or prediction tool. In addition, the determination of a suitable life test sequence for these devices was of importance. Conclusions reached based on the parts tested and the test results obtained was that the devices were not acceptable.

  14. A circuit model for the explosive-driven plate generator

    NASA Astrophysics Data System (ADS)

    Caird, R. S.; Erickson, D. J.; Fowler, C. M.; Freeman, B. L.; Goforth, J. H.

    Explosive-driven generators are modelled as lumped parameter circuit elements in order to estimate performance in applications and to optimize the design of experiments. The plate generator is essentially a parallel or tilted plate transmission line in which the current-carrying flat plate conductors are driven by plane wave explosive systems. A simple model for the time-varying inductance of this system was developed. First, an analytic expression is used to predict the plate motion. Then, the inductance is expressed as a function of plate separation to give the computational model. Time-dependent flux losses are accounted for by an increasing waste inductance. Model predictions are compared with the available shot data.

  15. Representation of Type 4 wind turbine generator for steady state short-circuit calculations

    NASA Astrophysics Data System (ADS)

    Kamara, Wouleye

    commercial distribution system analysis program, to perform short-circuit calculations in multiphase complex unbalanced systems. Detailed study of the behavior of Type 4 wind turbine generator using electromagnetic type programs like EMTP-RV has assessed that the proposed model closely reproduces the real behavior of the wind turbine generator under steady-state fault conditions. The proposed model is then implemented in CYME 7.0 and validated for different fault scenarios using the Fortis Alberta 25 kV distribution system as benchmark. The fault contribution obtained from the proposed model is compared against the one obtained from the previous model implemented in CYME 7.0. The validation test cases show that the proposed model estimates the fault contribution of the wind turbine generator with better precision than the former models. Besides, the performance and robustness of the short-circuit algorithm developed allow handling unbalanced networks with inverter interfaced wind turbine generators as it is based on the MANA formulation.

  16. Equivalent diagram of a solar cell, based on short-circuit and open-circuit tests

    NASA Astrophysics Data System (ADS)

    Slonim, Michael A.; Tslaf, Avraam L.

    1987-12-01

    A novel equivalent diagram of a solar cell is developed. A solar cell array is represented by a voltage source E and two internal resistances r(sc) and r(oc) which are determined from short-cirucit and open-circuit tests. E is constant and does not depend on irradiation; r(sc) is constant for given irradiation; r(oc) is constant for given irradiation under the open-circuit condition but changes its value with varying load. An example is presented for calculation of the parameters in the equivalent diagram using the experimental output characteristic of a cell. An analysis is made of the trend in parameters of modern solar cells for the developed diagram. The diagram allows the use of ordinary calculation and design techniques for the analysis of circuits with solar cells.

  17. MIRAGE read-in integrated circuit testing results

    NASA Astrophysics Data System (ADS)

    Hoelter, Theodore R.; Henry, Blake A.; Graff, John H.; Aziz, Naseem Y.

    1999-07-01

    This paper describes the test results for the MIRAGE read- in-integrated-circuit (RIIC) designed by Indigo Systems Corporation. This RIIC, when mated with suspended membrane, micro-machined resistive elements, forms a highly advanced emitter array. This emitter array is used by Indigo and Santa Barbara Infrared Incorporated in a jointly developed product for infrared scene generation, called MIRAGE. The MIRAGE RIIC is a 512 X 512 pixel design which incorporates a number of features that extend the state of the art for emitter array RIIC devices. These innovations include an all-digital interface for scene data, snapshot image updates (all pixels show the new frame simultaneously), frame rates up to 200 Hz, operating modes that control the device output, power consumption, and diagnostic configuration. Tests measuring operating speed, RIIC functionality and D/A converter performance were completed. At 2.1 X 2.3 cm, this die is also the largest nonstitched device ever made by Indigo's foundry, American Microsystems Incorporated. As with any IC design, die yield is a critical factor that typically scales with the size and complexity. Die yield, and a statistical breakdown of the failures observed will be discussed.

  18. Ring Counter Based ATPG for Low Transition Test Pattern Generation

    PubMed Central

    Begam, V. M. Thoulath; Baulkani, S.

    2015-01-01

    In test mode test patterns are applied in random fashion to the circuit under circuit. This increases switching transition between the consecutive test patterns and thereby increases dynamic power dissipation. The proposed ring counter based ATPG reduces vertical switching transitions by inserting test vectors only between the less correlative test patterns. This paper presents the RC-ATPG with an external circuit. The external circuit consists of XOR gates, full adders, and multiplexers. First the total number of transitions between the consecutive test patterns is determined. If it is more, then the external circuit generates and inserts test vectors in between the two test patterns. Test vector insertion increases the correlation between the test patterns and reduces dynamic power dissipation. The results prove that the test patterns generated by the proposed ATPG have fewer transitions than the conventional ATPG. Experimental results based on ISCAS'85 and ISCAS'89 benchmark circuits show 38.5% reduction in the average power and 50% reduction in the peak power attained during testing with a small size decoding logic. PMID:26075295

  19. A Testing System for Diagnosing Misconceptions in DC Electric Circuits.

    ERIC Educational Resources Information Center

    Chang, Kuo-En; Liu, Sei-Hua; Chen, Sei-Wang

    1998-01-01

    Outlines a test-based diagnosis system for misconceptions in DC electric circuits and its three parts: problem library, problem selector and diagnoser. Discusses misconception discrimination and diagnosis theories, and reports the system supports satisfactory diagnosis. Includes an analysis of nine student misconceptions about electrical circuits…

  20. Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits

    NASA Astrophysics Data System (ADS)

    Hu, Geng; Wang, Hong; Yang, Shiyuan

    Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.

  1. Radiation Testing and Evaluation Issues for Modern Integrated Circuits

    NASA Technical Reports Server (NTRS)

    LaBel, Kenneth A.; Cohn, Lew M.

    2005-01-01

    Abstract. Changes in modern integrated circuit (IC) technologies have modified the way we approach and conduct radiation tolerance and testing of electronics. These changes include scaling of geometries, new materials, new packaging technologies, and overall speed and device complexity challenges. In this short course section, we will identify and discuss these issues as they impact radiation testing, modeling, and effects mitigation of modern integrated circuits. The focus will be on CMOS-based technologies, however, other high performance technologies will be discussed where appropriate. The effects of concern will be: Single-Event Effects (SEE) and steady state total ionizing dose (TID) IC response. However, due to the growing use of opto-electronics in space systems issues concerning displacement damage testing will also be considered. This short course section is not intended to provide detailed "how-to-test" information, but simply provide a snapshot of current challenges and some of the approaches being considered.

  2. Laser system for testing radiation imaging detector circuits

    NASA Astrophysics Data System (ADS)

    Zubrzycka, Weronika; Kasinski, Krzysztof

    2015-09-01

    Performance and functionality of radiation imaging detector circuits in charge and position measurement systems need to meet tight requirements. It is therefore necessary to thoroughly test sensors as well as read-out electronics. The major disadvantages of using radioactive sources or particle beams for testing are high financial expenses and limited accessibility. As an alternative short pulses of well-focused laser beam are often used for preliminary tests. There are number of laser-based devices available on the market, but very often their applicability in this field is limited. This paper describes concept, design and validation of laser system for testing silicon sensor based radiation imaging detector circuits. The emphasis is put on keeping overall costs low while achieving all required goals: mobility, flexible parameters, remote control and possibility of carrying out automated tests. The main part of the developed device is an optical pick-up unit (OPU) used in optical disc drives. The hardware includes FPGA-controlled circuits for laser positioning in 2 dimensions (horizontal and vertical), precision timing (frequency and number) and amplitude (diode current) of short ns-scale (3.2 ns) light pulses. The system is controlled via USB interface by a dedicated LabVIEW-based application enabling full manual or semi-automated test procedures.

  3. Experiences in the use of evolutionary techniques for testing digital circuits

    NASA Astrophysics Data System (ADS)

    Corno, Fulvio; Rebaudengo, Maurizio; Sonza Reorda, Matteo

    1998-10-01

    The generation of test patterns for sequential circuits is one of the most challenging problems arising in the field of Computer-Aided Design for VLSI circuits. In the past decade, Genetic Algorithms have been deeply investigated as a possible approach: several algorithms have been described, and significant improvements have been proposed with respect to their original versions. As a result, GA-based test pattern generators can now effectively compete with other methods, such as topological or symbolic ones. This paper discusses the advantages and disadvantages of GA-based approaches and describes GATTO, a state-of-the-art GA-based test pattern generator. Other algorithms belonging to the same category are outlined as well. The paper puts GATTO and other GA-based tools in perspective, and shows that Evolutionary computation techniques can successfully compete with more traditional approaches, or be integrated with them.

  4. Providing Reliability of Physical Systems: Fully Delay Testable Logical Circuit Design with Compact Representation of all PDF Test Pairs

    NASA Astrophysics Data System (ADS)

    Matrosova, A. Yu.; Mitrofanov, E. V.; Akhynova, D. I.

    2016-01-01

    Functional reliability is one of the important properties of physical systems provided by reliability of system components, in particular, control logical components. The new approach to fully delay testable circuit design oriented to cut overheads and lengths of circuit paths has been developed. Compact representation of all PDF test pairs is reduced to keeping the corresponding generative vector pairs. The number of generative vector pairs does not exceed the doubled number of internal ROBDD nodes originating from the circuit, while the number of the circuit paths can exponentially depend on the number of these internal nodes. The algorithm of involving the PDF test pair from the proper generative vector pair is suggested. This procedure does not require essential calculations. The algorithm of deriving the generative vector pair has a polynomial complexity.

  5. Relay test program. Series 2 tests: Integral testing of relays and circuit breakers

    SciTech Connect

    Bandyopadhyay, K.K.; Kunkel, C.; Shteyngart, S.

    1994-02-01

    This report presents the results of a relay test program conducted by Brookhaven National Laboratory (BNL) under the sponsorship of the US Nuclear Regulatory Commission (NRC). The program is a continuation of an earlier test program the results of which were published in NUREG/CR-4867. The current program was carried out in two phases: electrical testing and vibration testing. The objective was primarily to focus on the electrical discontinuity or continuity of relays and circuit breaker tripping mechanisms subjected to electrical pulses and vibration loads. The electrical testing was conducted by KEMA-Powertest Company and the vibration testing was performed at Wyle Laboratories, Huntsville, Alabama. This report discusses the test procedures, presents the test data, includes an analysis of the data and provides recommendations regarding reliable relay testing.

  6. Function electrical stimulation signals generator circuits for the central nerve and the sciatic nerve.

    PubMed

    Wenyuan, Li; Zhenyu, Zhang; Zhi-Gong, Wang

    2005-01-01

    Circuits for the signal generation of the FES (functional electrical stimulation) of the central nerve and the sciatic nerve have been designed. The circuits were implemented by using discrete devices. The FES circuits consist of two or three operational amplifiers. The bandwidths of the circuits are more than 10 kHz and their gains are variable from 20 dB to 60 dB. To a load of several kilo-ohms, according to the microelectrode with the nerve, the circuit for stimulating central nerve can provide a current signal, and the signal value is more than 1mA. The circuit for stimulating sciatic nerve can provide a stimulating voltage signal of more than 10 Vs. The loads of the circuits are microelectrodes contacted with nerves. The circuits can be used with two kinds of microelectrodes: cuff microelectrodes which for stimulating sciatic nerve and shaft microelectrodes which for stimulating central nerve. PMID:17281443

  7. Circuit design for nuclear radiation test of CMOS multiplier chips

    SciTech Connect

    Lim, T.S.; Martin, R.L.; Hughes, H.L.

    1986-09-01

    This paper describes the design of a microprocessor-based electronic circuit to be used in testing the effects of nuclear radiation on a CMOS 8 x 8 multiplier chip. Knowledge of such effects is important for military and space applications of integrated circuits. The multiplier chip undergoing testing is attached to a DUT (device under test) board which is enclosed in a metal container. The container is then lowered to the cobalt 60 radiation source located at the bottom of a 15-ft-deep pool. The gamma-ray radiation test setup is schematically shown. The in-source test board containing the multiplier chip is attached to an 8085-based, single-board microcomputer (SDK-85) by a 30-ft multiconductor cable. Doses of gamma-ray radiation from cobalt 60 are applied in steps at increasing quantities until the multiplier chip, which is tested between doses, begins to malfunction. An 8085 assembly language program is used for functional test of the multiplier. The leakage current and the propagation delay time are also measured between doses.

  8. Combinatorial Generation of Test Suites

    NASA Technical Reports Server (NTRS)

    Dvorak, Daniel L.; Barrett, Anthony C.

    2009-01-01

    Testgen is a computer program that generates suites of input and configuration vectors for testing other software or software/hardware systems. As systems become ever more complex, often, there is not enough time to test systems against all possible combinations of inputs and configurations, so test engineers need to be selective in formulating test plans. Testgen helps to satisfy this need: In response to a test-suite-requirement-specification model, it generates a minimal set of test vectors that satisfies all the requirements.

  9. Universal nondestructive mm-wave integrated circuit test fixture

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert R. (Inventor); Shalkhauser, Kurt A. (Inventor)

    1990-01-01

    Monolithic microwave integrated circuit (MMIC) test includes a bias module having spring-loaded contacts which electrically engage pads on a chip carrier disposed in a recess of a base member. RF energy is applied to and passed from the chip carrier by chamfered edges of ridges in the waveguide passages of housings which are removably attached to the base member. Thru, Delay, and Short calibration standards having dimensions identical to those of the chip carrier assure accuracy and reliability of the test. The MMIC chip fits in an opening in the chip carrier with the boundaries of the MMIC lying on movable reference planes thereby establishing accuracy and flexibility.

  10. Capabilities and Testing of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK), which was used in the SNAP-10A fission reactor, was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around a 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. NaK flow rates of greater than 1 kg/sec may be achieved, depending upon the power applied to the EM pump. The heat exchanger provides for the removal of thermal energy from the circuit, simulating the presence of an energy conversion system. The presence of the test section increases the versatility of the circuit. A second liquid metal pump, an energy conversion system, and highly instrumented thermal simulators are all being considered for inclusion within the test section. This paper summarizes the capabilities and ongoing testing of the Fission Surface Power Primary Test Circuit (FSP-PTC).

  11. Apparatus and method for defect testing of integrated circuits

    DOEpatents

    Cole, Jr., Edward I.; Soden, Jerry M.

    2000-01-01

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V.sub.DD, to an IC under test and measures a transient voltage component, V.sub.DDT, signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V.sub.DDT signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V.sub.DDT signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  12. Apparatus and method for defect testing of integrated circuits

    SciTech Connect

    Cole, E.I. Jr.; Soden, J.M.

    2000-02-29

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V(DD), to an IC under test and measures a transient voltage component, V(DDT), signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V(DDT) signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V(DDT) signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  13. Series and parallel arc-fault circuit interrupter tests.

    SciTech Connect

    Johnson, Jay; Fresquez, Armando J.; Gudgel, Bob; Meares, Andrew

    2013-07-01

    While the 2011 National Electrical Code%C2%AE (NEC) only requires series arc-fault protection, some arc-fault circuit interrupter (AFCI) manufacturers are designing products to detect and mitigate both series and parallel arc-faults. Sandia National Laboratories (SNL) has extensively investigated the electrical differences of series and parallel arc-faults and has offered possible classification and mitigation solutions. As part of this effort, Sandia National Laboratories has collaborated with MidNite Solar to create and test a 24-string combiner box with an AFCI which detects, differentiates, and de-energizes series and parallel arc-faults. In the case of the MidNite AFCI prototype, series arc-faults are mitigated by opening the PV strings, whereas parallel arc-faults are mitigated by shorting the array. A range of different experimental series and parallel arc-fault tests with the MidNite combiner box were performed at the Distributed Energy Technologies Laboratory (DETL) at SNL in Albuquerque, NM. In all the tests, the prototype de-energized the arc-faults in the time period required by the arc-fault circuit interrupt testing standard, UL 1699B. The experimental tests confirm series and parallel arc-faults can be successfully mitigated with a combiner box-integrated solution.

  14. A Digital Coreless Maximum Power Point Tracking Circuit for Thermoelectric Generators

    NASA Astrophysics Data System (ADS)

    Kim, Shiho; Cho, Sungkyu; Kim, Namjae; Baatar, Nyambayar; Kwon, Jangwoo

    2011-05-01

    This paper describes a maximum power point tracking (MPPT) circuit for thermoelectric generators (TEG) without a digital controller unit. The proposed method uses an analog tracking circuit that samples the half point of the open-circuit voltage without a digital signal processor (DSP) or microcontroller unit for calculating the peak power point using iterative methods. The simulation results revealed that the MPPT circuit, which employs a boost-cascaded-with-buck converter, handled rapid variation of temperature and abrupt changes of load current; this method enables stable operation with high power transfer efficiency. The proposed MPPT technique is a useful analog MPPT solution for thermoelectric generators.

  15. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least...

  16. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least...

  17. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  18. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  19. Microwave generators simplify swept tests

    NASA Astrophysics Data System (ADS)

    Foster, C. E.; Hagins, M. R.

    1986-01-01

    The utilization of the swept-frequency capability makes it possible to conduct any number of microwave tests. It is pointed out that today's microwave sweepers make such tests simple and straightforward. A filter test involving a high-pass filter with a cutoff frequency of 14.0 GHz is discussed, taking into account the use of a microwave sweeper operating in the range from 12 to 18 GHz. Attention is also given to swept-frequency amplifier testing, antenna swept-gain testing, and microwave antenna testing. With a sweep generator, it is simple to assemble a setup for testing amplifier small-signal gain, flatness, and rolloff.

  20. Analysis of Non-Standard Lightning Impulse Voltage for Actual Substation and Generation Circuit

    NASA Astrophysics Data System (ADS)

    Okabe, Shigemitsu; Koutou, Masanori; Yuasa, Sadayuki; Suzuki, Toshiyuki; Rokunohe, Toshiaki; Yamagiwa, Tokio

    Evaluation of lightning surge waveforms that actually enter into substations is important when investigating the test voltage of electric power equipment. The standard lightning impulse waveform (1.2/50μs) is used for factory tests. However, the actual lightning surge waveforms in actual substations are complex waveforms in which various different oscillations are superimposed. Investigation of insulation characteristics of equipment against the complex waveforms and the standard one has significant importance. We analyzed these waveforms entering actual substations with respect to the insulation characteristics of gas insulated switchigear (GIS). From the results, we defined four types of non-standard lightning impulse waveforms. Then non-standard lightning impulse voltage is generated by an equipment circuit which is consisted of an impulse generator (IG), R, L and C is analyzed with EMTP. Voltage time characteristics were evaluated from the obtained impulse voltages.

  1. Generation of nearly hemispherical and high gain azimuthally symmetric patterns with printed circuit antennas

    NASA Astrophysics Data System (ADS)

    Yang, Hung Yu; Alexopoulos, Nicolaos G.

    1987-08-01

    Patttern shaping techniques are discussed for printed circuit antennas such as microstrip dipoles and slot elements. Crossed printed circuit dipoles or a combination of a printed circuit dipole and a slot are employed. It is demonstrated that with the proper choice of substrate or substrate-superstrate parameters it is possible to generate: (1) nearly hemispherical patterns, (2) high-gain azimuthally symmetric patterns, and (3) nearly sec theta patterns.

  2. Testing interconnected VLSI circuits in the Big Viterbi Decoder

    NASA Technical Reports Server (NTRS)

    Onyszchuk, I. M.

    1991-01-01

    The Big Viterbi Decoder (BVD) is a powerful error-correcting hardware device for the Deep Space Network (DSN), in support of the Galileo and Comet Rendezvous Asteroid Flyby (CRAF)/Cassini Missions. Recently, a prototype was completed and run successfully at 400,000 or more decoded bits per second. This prototype is a complex digital system whose core arithmetic unit consists of 256 identical very large scale integration (VLSI) gate-array chips, 16 on each of 16 identical boards which are connected through a 28-layer, printed-circuit backplane using 4416 wires. Special techniques were developed for debugging, testing, and locating faults inside individual chips, on boards, and within the entire decoder. The methods are based upon hierarchical structure in the decoder, and require that chips or boards be wired themselves as Viterbi decoders. The basic procedure consists of sending a small set of known, very noisy channel symbols through a decoder, and matching observables against values computed by a software simulation. Also, tests were devised for finding open and short-circuited wires which connect VLSI chips on the boards and through the backplane.

  3. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  4. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  5. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  6. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  7. Soft-error generation due to heavy-ion tracks in bipolar integrated circuits

    NASA Technical Reports Server (NTRS)

    Zoutendyk, J. A.

    1984-01-01

    Both bipolar and MOS integrated circuits have been empirically demonstrated to be susceptible to single-particle soft-error generation, commonly referred to as single-event upset (SEU), which is manifested in a bit-flip in a latch-circuit construction. Here, the intrinsic characteristics of SEU in bipolar (static) RAM's are demonstrated through results obtained from the modeling of this effect using computer circuit-simulation techniques. It is shown that as the dimensions of the devices decrease, the critical charge required to cause SEU decreases in proportion to the device cross-section. The overall results of the simulations are applicable to most integrated circuit designs.

  8. 37. SAR2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    37. SAR-2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD COIL CONTROL RHEOSTATS (BELOW). SCE negative no. 10331, November 1, 1923. Photograph by G. Haven Bishop. - Santa Ana River Hydroelectric System, SAR-2 Powerhouse, Redlands, San Bernardino County, CA

  9. Test Generator for MATLAB Simulations

    NASA Technical Reports Server (NTRS)

    Henry, Joel

    2011-01-01

    MATLAB Automated Test Tool, version 3.0 (MATT 3.0) is a software package that provides automated tools that reduce the time needed for extensive testing of simulation models that have been constructed in the MATLAB programming language by use of the Simulink and Real-Time Workshop programs. MATT 3.0 runs on top of the MATLAB engine application-program interface to communicate with the Simulink engine. MATT 3.0 automatically generates source code from the models, generates custom input data for testing both the models and the source code, and generates graphs and other presentations that facilitate comparison of the outputs of the models and the source code for the same input data. Context-sensitive and fully searchable help is provided in HyperText Markup Language (HTML) format.

  10. Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools

    NASA Astrophysics Data System (ADS)

    Higami, Yoshinobu; Saluja, Kewal K.; Takahashi, Hiroshi; Kobayashi, Shin-Ya; Takamatsu, Yuzo

    This paper presents methods for detecting transistor short faults using logic level fault simulation and test generation. The paper considers two types of transistor level faults, namely strong shorts and weak shorts, which were introduced in our previous research. These faults are defined based on the values of outputs of faulty gates. The proposed fault simulation and test generation are performed using gate-level tools designed to deal with stuck-at faults, and no transistor-level tools are required. In the test generation process, a circuit is modified by inserting inverters, and a stuck-at test generator is used. The modification of a circuit does not mean a design-for-testability technique, as the modified circuit is used only during the test generation process. Further, generated test patterns are compacted by fault simulation. Also, since the weak short model involves uncertainty in its behavior, we define fault coverage and fault efficiency in three different way, namely, optimistic, pessimistic and probabilistic and assess them. Finally, experimental results for ISCAS benchmark circuits are used to demonstrate the effectiveness of the proposed methods.

  11. Note: Picosecond impulse generator driven by cascaded step recovery diode pulse shaping circuit.

    PubMed

    Choi, Gil Wong; Choi, Jin Joo; Han, Seung Hoon

    2011-01-01

    In this paper, a picosecond impulse generator using step recovery diodes (SRDs) is presented. In order to reduce the pulse width of an impulse generator, we employed a cascaded SRD pulse-shaping circuit. A short impulse generation is confirmed in numerical simulation of a time-transient circuit simulator. Measurements show that the measured pulse width of the cascaded SRD impulse generator is 250 ps at 10% of the peak amplitude, which is improved by 85 ps compared with a conventional SRD impulse generator. PMID:21280869

  12. Note: Picosecond impulse generator driven by cascaded step recovery diode pulse shaping circuit

    NASA Astrophysics Data System (ADS)

    Wong Choi, Gil; Joo Choi, Jin; Hoon Han, Seung

    2011-01-01

    In this paper, a picosecond impulse generator using step recovery diodes (SRDs) is presented. In order to reduce the pulse width of an impulse generator, we employed a cascaded SRD pulse-shaping circuit. A short impulse generation is confirmed in numerical simulation of a time-transient circuit simulator. Measurements show that the measured pulse width of the cascaded SRD impulse generator is 250 ps at 10% of the peak amplitude, which is improved by 85 ps compared with a conventional SRD impulse generator.

  13. A test technique for measuring lightning-induced voltages on aircraft electrical circuits

    NASA Technical Reports Server (NTRS)

    Walko, L. C.

    1974-01-01

    The development of a test technique used for the measurement of lightning-induced voltages in the electrical circuits of a complete aircraft is described. The resultant technique utilizes a portable device known as a transient analyzer capable of generating unidirectional current impulses similar to lightning current surges, but at a lower current level. A linear relationship between the magnitude of lightning current and the magnitude of induced voltage permitted the scaling up of measured induced values to full threat levels. The test technique was found to be practical when used on a complete aircraft.

  14. Design and testing of integrated circuits for reactor protection channels

    SciTech Connect

    Battle, R.E.; Vandermolen, R.I.; Jagadish, U.; Swail, B.K.; Naser, J.; Rana, I.

    1995-06-01

    Custom and semicustom application-specific integrated circuit design and testing methods are investigated for use in research and commercial nuclear reactor safety systems. The Electric Power Research Institute and Oak Ridge National Laboratory are working together through a cooperative research and development agreement to apply modern technology to a nuclear reactor protection system. Purpose of this project is to demonstrate to the nuclear industry an alternative approach for new or upgrade reactor protection and safety system signal processing and voting logic. Motivation for this project stems from (1) the difficulty of proving that software-based protection systems are adequately reliable, (2) the obsolescence of the original equipment, and (3) the improved performance of digital processing.

  15. New downhole steam generator tested

    SciTech Connect

    Bleakley, W.B.

    1981-07-01

    Completion of 2 field tests of a new-model down-hole steam generator paves the way for further evaluation and development of a system destined to increase California's heavy oil production. Current air pollution restrictions there prevent installation of conventional steam generators in several areas of interest to oil operators. The current series of tests, conducted by Chemical Oil Recovery Co. (CORCO) of Bakersfield, California, follows an earlier prototype operation conducted by Sandia National Laboratories in conjunction with the US Department of Energy. The CORCO tests were conducted on the surface with the generator's output going into Tenneco Oil Exploration and Production Co.'s overland-Riokern Well No. 80, located in the Kern River field 4 miles north of Bakersfield. The first test was concluded with just under 1000 bbl of steam injected, less than planned due to a higher-than-expected injection pressure. The unit operated at less than 25% capacity because of the air compressor limitation. Compressor output was only 285 psi, not enough to inject the desired volumes into the reservoir. Test data shows that injection amounted to 150 bpd of 90 to 95% quality steam at 225-psi wellhead pressure. After injection, the well was shut in for 3 days to allow soaking, then put on production. Initial production was 40 bopd at 175 F.

  16. Research of 100 MHz ultra-low-jitter clock generating circuit

    SciTech Connect

    Qiu, Duyu; Tan, Feng; Tian, Shulin; Zeng, Hao; Ye, Peng

    2015-04-15

    Jitter which quantifies the quality of a clock is an important specification. It is of great significance for an electronic system. To obtain a good signal-to-noise ratio for sampling systems, there must be clocks with low jitter performances. By using the relationship between jitter and phase noise, the 100 MHz clock generating circuit with ultra-low jitter and phase noise characteristics are studied in this paper. Bipolar junction transistor with low noise figure and low corner frequency should be selected. Inductance and capacitance in the feedback circuit are obviously the main contributions to the jitter. Impacts of the loaded quality factor (Q{sub L}) of the circuit on the jitter are analyzed, and the explicit expression for the jitter based on circuit components is derived as well. The simulation and experiment results are proved to show that the jitter and phase noise characteristics can be improved by increasing Q{sub L} of the circuit.

  17. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, Lowell B.

    1998-01-01

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.

  18. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, L.B.

    1998-08-18

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

  19. The Generation Effect: Activating Broad Neural Circuits During Memory Encoding

    PubMed Central

    Rosner, Zachary A.; Elman, Jeremy A.; Shimamura, Arthur P.

    2012-01-01

    The generation effect is a robust memory phenomenon in which actively producing material during encoding acts to improve later memory performance. In an fMRI analysis, we explored the neural basis of this effect. During encoding, participants generated synonyms from word-fragment cues (e.g. GARBAGE-W_ST_) or read other synonym pairs (e.g. GARBAGE-WASTE). Compared to simply reading target words, generating target words significantly improved later recognition memory performance. During encoding, this benefit was associated with a broad neural network that involved both prefrontal (inferior frontal gyrus, middle frontal gyrus) and posterior cortex (inferior temporal gyrus, lateral occipital cortex, parahippocampal gyrus, ventral posterior parietal cortex). These findings define the prefrontal-posterior cortical dynamics associated with the mnemonic benefits underlying the generation effect. PMID:23079490

  20. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be...) water-column height when full container pressure is applied. (c) Where pressure demand apparatus...

  1. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be...) water-column height when full container pressure is applied. (c) Where pressure demand apparatus...

  2. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be...) water-column height when full container pressure is applied. (c) Where pressure demand apparatus...

  3. Modifications and Modelling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Ann E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of the Single Flow Cell Test Apparatus (SFCTA) in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. The SFCTA, which will be tested simultaneously, will provide data on alkali metal flow behavior through the simulated core channels and assist in the development of a second generation thermal simulator. Additionally, data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  4. Downhole steam generator: field tests

    SciTech Connect

    Eson, R.L.

    1982-01-01

    Excessive air pollution and heat losses up to 32% in the surface lines and out the stacks of conventional generators are reasons why conventional steam generation is efficient. These problems are addressed and overcome through the use of a direct-fired down-hole steam generator (DSG). By performing the combustion process at high pressure, and then adding water, a mixture of carbon dioxide, nitrogen, and steam is discharged directly into the heavy oil reservoir. This study documents a series of field tests of a direct-fired DSG showing its ability to produce and inject high quality steam into heavy oil reservoirs without the need for expensive stack scrubbers to remove sulfur dioxide (SO/sub 2/), as well as sophisticated nitrogen oxides (NO/sub x/) control techniques. Results from the 6-in. diameter, 6-ft long, 7.1-mmBtu/hr DSG showed that corrosion can be controlled and production can be improved dramatically in actual field tests in California heavy oil reservoirs.

  5. Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

    NASA Technical Reports Server (NTRS)

    Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

    2003-01-01

    The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

  6. Optimal testing input sets for reduced diagnosis time of nuclear power plant digital electronic circuits

    SciTech Connect

    Kim, D.S.; Seong, P.H. . Dept. of Nuclear Engineering)

    1994-02-01

    This paper describes the optimal testing input sets required for the fault diagnosis of the nuclear power plant digital electronic circuits. With the complicated systems such as very large scale integration (VLSI), nuclear power plant (NPP), and aircraft, testing is the major factor of the maintenance of the system. Particularly, diagnosis time grows quickly with the complexity of the component. In this research, for reduce diagnosis time the authors derived the optimal testing sets that are the minimal testing sets required for detecting the failure and for locating of the failed component. For reduced diagnosis time, the technique presented by Hayes fits best for the approach to testing sets generation among many conventional methods. However, this method has the following disadvantages: (a) it considers only the simple network (b) it concerns only whether the system is in failed state or not and does not provide the way to locate the failed component. Therefore the authors have derived the optimal testing input sets that resolve these problems by Hayes while preserving its advantages. When they applied the optimal testing sets to the automatic fault diagnosis system (AFDS) which incorporates the advanced fault diagnosis method of artificial intelligence technique, they found that the fault diagnosis using the optimal testing sets makes testing the digital electronic circuits much faster than that using exhaustive testing input sets; when they applied them to test the Universal (UV) Card which is a nuclear power plant digital input/output solid state protection system card, they reduced the testing time up to about 100 times.

  7. Emulation of high-frequency substrate noise generation in CMOS digital circuits

    NASA Astrophysics Data System (ADS)

    Shimazaki, Shunsuke; Taga, Shota; Makita, Tetsuya; Azuma, Naoya; Miura, Noriyuki; Nagata, Makoto

    2014-01-01

    A noise emulator is based on the capacitor charging modeling and generates power and substrate noises expected in a CMOS digital integrated circuit. An off-chip near-magnetic-field sensor indirectly characterizes the distribution of clock timing and the adjustability of skews within on-chip digital circuits. An on-chip noise monitor captures power and substrate noise waveforms and evaluates noise frequency components in a wide frequency bandwidth. A 65 nm CMOS prototype demonstrated power and substrate noise generation in a variety of operating scenarios of digital integrated circuits. Power noise generation emulated at 125 MHz exhibits the enhancements of high-order harmonic components after deskewing at a timing resolution of 37.8 ps, as is specifically seen in more than 10 dB enlargement of the substrate noise component at 2.1 GHz.

  8. Neural circuits underlying the generation of theta oscillations.

    PubMed

    Pignatelli, Michele; Beyeler, Anna; Leinekugel, Xavier

    2012-01-01

    Theta oscillations represent the neural network configuration underlying active awake behavior and paradoxical sleep. This major EEG pattern has been extensively studied, from physiological to anatomical levels, for more than half a century. Nevertheless the cellular and network mechanisms accountable for the theta generation are still not fully understood. This review synthesizes the current knowledge on the circuitry involved in the generation of theta oscillations, from the hippocampus to extra hippocampal structures such as septal complex, entorhinal cortex and pedunculopontine tegmentum, a main trigger of theta state through direct and indirect projections to the septal complex. We conclude with a short overview of the perspectives offered by technical advances for deciphering more precisely the different neural components underlying the emergence of theta oscillations. PMID:21964249

  9. An oscillatory neuronal circuit generating a locomotory rhythm.

    PubMed Central

    Friesen,, W O; Poon, M; Stent, G S

    1976-01-01

    A quartet of interconnected interneurons whose periodic activity appears to generate the traveling body wave of the swimming leech has been identified on each side of segmental ganglia of the ventral nerve cord of Hirudo medicinalis. Theoretical analysis and electronic analog models of the identified intra- and interganglionic synaptic connections of the segmentally iterated interneurons showed that they form an oscillatory network with cycle period and intra-and intersegmental phase relations appropriate for the swimming movement. Images PMID:1068483

  10. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2012-10-01 2012-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will...

  11. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2013-10-01 2013-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will...

  12. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 47 Telecommunication 5 2011-10-01 2011-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit diagrams and testing equipment. (a) Each ship station must be provided with such tools, testing...

  13. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand...

  14. A complete hardening method for the generation of fault tolerant circuits

    NASA Astrophysics Data System (ADS)

    Portela-Garcia, Marta; Garcia-Valderas, Mario; Lopez-Ongil, Celia; Entrena, Luis

    2005-06-01

    Fault Tolerance has become an important requirement for integrated circuits, not only in safety critical applications like aerospace circuits, but also for applications working at the earth surface. Since the appearance of nanometer technologies, the sensitiveness of integrated circuits to radiation has increased notably, making the occurrence of soft errors much more frequent. Therefore, hardened circuits are currently required in many applications where fault tolerance was not a requirement in the very near past. In this paper, tools and methods for the whole hardening process of a circuit are presented: tools for the automatic insertion of fault tolerant structures in a circuit description and methods for the evaluation of fault tolerance achieved. These methods allow the evaluation of fault tolerance by means of emulation in platform FPGAs, which offer a much faster way to perform evaluation than simulation based techniques. Different circuits are used to test the proposed tool for inserting fault tolerant structures. Fault tolerance evaluation is performed using the proposed fault emulation methods, before and after applying hardening process, showing the fault tolerance improvement. The proposed techniques for evaluation have been compared, in terms of evaluation time, with previously proposed solutions and with simulation based solutions, showing improvements of several orders of magnitude.

  15. Split-cross-bridge resistor for testing for proper fabrication of integrated circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G. (Inventor)

    1985-01-01

    An electrical testing structure and method is described whereby a test structure is fabricated on a large scale integrated circuit wafer along with the circuit components and has a van der Pauw cross resistor in conjunction with a bridge resistor and a split bridge resistor, the latter having two channels each a line width wide, corresponding to the line width of the wafer circuit components, and with the two channels separated by a space equal to the line spacing of the wafer circuit components. The testing structure has associated voltage and current contact pads arranged in a two by four array for conveniently passing currents through the test structure and measuring voltages at appropriate points to calculate the sheet resistance, line width, line spacing, and line pitch of the circuit components on the wafer electrically.

  16. Performance testing of thermoelectric generators at JPL

    NASA Technical Reports Server (NTRS)

    Rouklove, P.; Truscello, V.

    1974-01-01

    Results of life tests of thermoelectric generators ranging in output power from 800 microwatts to 170 watts. Emphasis is placed on the results obtained from tests of three advanced prototypes - a high-performance generator, a transit-type generator, and a ring converter. In addition, the results of life tests of a number of generators representing Nimbus, Pioneer, and Viking technology are presented.

  17. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator.

    PubMed

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results. PMID:25725867

  18. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator

    NASA Astrophysics Data System (ADS)

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results.

  19. Testing of printed circuit board solder joints by optical correlation

    NASA Technical Reports Server (NTRS)

    Espy, P. N.

    1975-01-01

    An optical correlation technique for the nondestructive evaluation of printed circuit board solder joints was evaluated. Reliable indications of induced stress levels in solder joint lead wires are achievable. Definite relations between the inherent strength of a solder joint, with its associated ability to survive stress, are demonstrable.

  20. Development and Simulation of Increased Generation on a Secondary Circuit of a Microgrid

    NASA Astrophysics Data System (ADS)

    Reyes, Karina

    As fossil fuels are depleted and their environmental impacts remain, other sources of energy must be considered to generate power. Renewable sources, for example, are emerging to play a major role in this regard. In parallel, electric vehicle (EV) charging is evolving as a major load demand. To meet reliability and resiliency goals demanded by the electricity market, interest in microgrids are growing as a distributed energy resource (DER). In this thesis, the effects of intermittent renewable power generation and random EV charging on secondary microgrid circuits are analyzed in the presence of a controllable battery in order to characterize and better understand the dynamics associated with intermittent power production and random load demands in the context of the microgrid paradigm. For two reasons, a secondary circuit on the University of California, Irvine (UCI) Microgrid serves as the case study. First, the secondary circuit (UC-9) is heavily loaded and an integral component of a highly characterized and metered microgrid. Second, a unique "next-generation" distributed energy resource has been deployed at the end of the circuit that integrates photovoltaic power generation, battery storage, and EV charging. In order to analyze this system and evaluate the impact of the DER on the secondary circuit, a model was developed to provide a real-time load flow analysis. The research develops a power management system applicable to similarly integrated systems. The model is verified by metered data obtained from a network of high resolution electric meters and estimated load data for the buildings that have unknown demand. An increase in voltage is observed when the amount of photovoltaic power generation is increased. To mitigate this effect, a constant power factor is set. Should the real power change dramatically, the reactive power is changed to mitigate voltage fluctuations.

  1. A versatile waveform generator for testing neuroelectric signal processors.

    PubMed

    Kohn, A F

    1989-08-01

    A multi-channel waveform generator was designed for testing neuroelectric signal processors. Smooth transient signals that resemble action potentials or evoked potentials are generated by a second order switched capacitor filter excited by brief rectangular pulses. The choice of an integrated circuit switched capacitor filter simplified the design by circumventing some of the disadvantages of conventional active filters. The waveform generator is versatile, with several signal parameters being independently adjustable from front panel controls: duration, waveshape, latency, amplitude and signal-to-noise ratio. The generator has been used for testing evoked potential acquisition and processing systems, for evaluating the effects of analog filters on evoked potentials and for testing systems designed to detect and classify trains of multi-unit action potentials. PMID:2770339

  2. Test Writing Made Simple: Generate Tests and Worksheets Electronically.

    ERIC Educational Resources Information Center

    Lodish, Erica

    1986-01-01

    Describes capabilities of test and worksheet generator software; discusses features to consider when evaluating the software for purchase; and presents reviews of eight test and worksheet generators: P.D.Q., Testmaster, Easy Quiz Maker, EA Mathematics Worksheet Generator, Mathematics Worksheet Generator, Earth Science Test Maker, Individualized…

  3. Variable cooling circuit for thermoelectric generator and engine and method of control

    DOEpatents

    Prior, Gregory P

    2012-10-30

    An apparatus is provided that includes an engine, an exhaust system, and a thermoelectric generator (TEG) operatively connected to the exhaust system and configured to allow exhaust gas flow therethrough. A first radiator is operatively connected to the engine. An openable and closable engine valve is configured to open to permit coolant to circulate through the engine and the first radiator when coolant temperature is greater than a predetermined minimum coolant temperature. A first and a second valve are controllable to route cooling fluid from the TEG to the engine through coolant passages under a first set of operating conditions to establish a first cooling circuit, and from the TEG to a second radiator through at least some other coolant passages under a second set of operating conditions to establish a second cooling circuit. A method of controlling a cooling circuit is also provided.

  4. Note: Complementary metal-oxide-semiconductor high voltage pulse generation circuits

    NASA Astrophysics Data System (ADS)

    Sun, Jiwei; Wang, Pingshan

    2013-10-01

    We present two types of on-chip pulse generation circuits. The first is based on CMOS pulse-forming-lines (PFLs). It includes a four-stage charge pump, a four-stacked-MOSFET switch and a 5 mm long PFL. The circuit is implemented in a 0.13 μm CMOS process. Pulses of ˜1.8 V amplitude with ˜135 ps duration on a 50 Ω load are obtained. The obtained voltage is higher than 1.6 V, the rated operating voltage of the process. The second is a high-voltage Marx generator which also uses stacked MOSFETs as high voltage switches. The output voltage is 11.68 V, which is higher than the highest breakdown voltage (˜10 V) of the CMOS process. These results significantly extend high-voltage pulse generation capabilities of CMOS technologies.

  5. Note: Complementary metal-oxide-semiconductor high voltage pulse generation circuits.

    PubMed

    Sun, Jiwei; Wang, Pingshan

    2013-10-01

    We present two types of on-chip pulse generation circuits. The first is based on CMOS pulse-forming-lines (PFLs). It includes a four-stage charge pump, a four-stacked-MOSFET switch and a 5 mm long PFL. The circuit is implemented in a 0.13 μm CMOS process. Pulses of ~1.8 V amplitude with ~135 ps duration on a 50 Ω load are obtained. The obtained voltage is higher than 1.6 V, the rated operating voltage of the process. The second is a high-voltage Marx generator which also uses stacked MOSFETs as high voltage switches. The output voltage is 11.68 V, which is higher than the highest breakdown voltage (~10 V) of the CMOS process. These results significantly extend high-voltage pulse generation capabilities of CMOS technologies. PMID:24182184

  6. Automated Test-Form Generation

    ERIC Educational Resources Information Center

    van der Linden, Wim J.; Diao, Qi

    2011-01-01

    In automated test assembly (ATA), the methodology of mixed-integer programming is used to select test items from an item bank to meet the specifications for a desired test form and optimize its measurement accuracy. The same methodology can be used to automate the formatting of the set of selected items into the actual test form. Three different…

  7. Initial Testing of the Stainless Steel NaK-Cooled Circuit (SNaKC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne; Godfroy, Thomas

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK) was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around the 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. This presentation addresses the construction, fill and initial testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  8. Design and test of clock distribution circuits for the Macro Pixel ASIC

    NASA Astrophysics Data System (ADS)

    Gaioni, L.; De Canio, F.; Manghisoni, M.; Ratti, L.; Re, V.; Traversi, G.

    2016-07-01

    Clock distribution circuits account for a significant fraction of the power dissipation of the Macro Pixel ASIC (MPA), designed for the pixel layer readout of the so-called Pixel-Strip module in the innermost part of the CMS tracker at the High Luminosity LHC. A test chip including low power clock distribution circuits of the MPA has been designed in a 65 nm CMOS technology and thoroughly tested. This work summarizes the experimental results relevant to the prototype chip, focusing particularly on the power and speed performance and compares such results with those coming from circuit simulations.

  9. Generator acceptance test and inspection report

    SciTech Connect

    Johns, B.R.

    1997-07-24

    This Acceptance Test Report(ATR) is the completed testing and inspection of the new portable generator. The testing and inspection is to verify that the generator provided by the vendor meets the requirements of specification WHC-S-0252, Revision 2. Attached is various other documentation to support the inspection and testing.

  10. Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits

    NASA Technical Reports Server (NTRS)

    Bennett, K.; Lala, P. K.; Busaba, F.

    1997-01-01

    Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor level and this technique is based on analyzing the off-set of the function during off-line testing.

  11. Feedback from network states generates variability in a probabilistic olfactory circuit

    PubMed Central

    Gordus, Andrew; Pokala, Navin; Levy, Sagi; Flavell, Steven W.; Bargmann, Cornelia I

    2016-01-01

    Summary Variability is a prominent feature of behavior, and an active element of certain behavioral strategies. To understand how neuronal circuits control variability, we examined the propagation of sensory information in a chemotaxis circuit of Caenorhabditis elegans where discrete sensory inputs can drive a probabilistic behavioral response. Olfactory neurons respond to odor stimuli with rapid and reliable changes in activity, but downstream AIB interneurons respond with a probabilistic delay. The interneuron response to odor depends on the collective activity of multiple neurons – AIB, RIM, and AVA -- when the odor stimulus arrives. Certain activity states of the network correlate with reliable responses to odor stimuli. Artificially generating these activity states by modifying neuronal activity increases the reliability of odor responses in interneurons and the reliability of the behavioral response to odor. The integration of sensory information with network state may represent a general mechanism for generating variability in behavior. PMID:25772698

  12. A miniature microcontroller curve tracing circuit for space flight testing transistors

    NASA Astrophysics Data System (ADS)

    Prokop, N.; Greer, L.; Krasowski, M.; Flatico, J.; Spina, D.

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results.

  13. Method of boundary testing of the electric circuits and its application for calculating electric tolerances. [electric equipment tests

    NASA Technical Reports Server (NTRS)

    Redkina, N. P.

    1974-01-01

    Boundary testing of electric circuits includes preliminary and limiting tests. Preliminary tests permit determination of the critical parameters causing the greatest deviation of the output parameter of the system. The boundary tests offer the possibility of determining the limits of the fitness of the system with simultaneous variation of its critical parameters.

  14. Architectures and Design for Next-Generation Hybrid Circuit/Packet Networks

    NASA Astrophysics Data System (ADS)

    Vadrevu, Sree Krishna Chaitanya

    Internet traffic is increasing rapidly at an annual growth rate of 35% with aggregate traffic exceeding several Exabyte's per month. The traffic is also becoming heterogeneous in bandwidth and quality-of-service (QoS) requirements with growing popularity of cloud computing, video-on-demand (VoD), e-science, etc. Hybrid circuit/packet networks which can jointly support circuit and packet services along with the adoption of high-bit-rate transmission systems form an attractive solution to address the traffic growth. 10 Gbps and 40 Gbps transmission systems are widely deployed in telecom backbone networks such as Comcast, AT&T, etc., and network operators are considering migration to 100 Gbps and beyond. This dissertation proposes robust architectures, capacity migration strategies, and novel service frameworks for next-generation hybrid circuit/packet architectures. In this dissertation, we study two types of hybrid circuit/packet networks: a) IP-over-WDM networks, in which the packet (IP) network is overlaid on top of the circuit (optical WDM) network and b) Hybrid networks in which the circuit and packet networks are deployed side by side such as US DoE's ESnet. We investigate techniques to dynamically migrate capacity between the circuit and packet sections by exploiting traffic variations over a day, and our methods show that significant bandwidth savings can be obtained with improved reliability of services. Specifically, we investigate how idle backup circuit capacity can be used to support packet services in IP-over-WDM networks, and similarly, excess capacity in packet network to support circuit services in ESnet. Control schemes that enable our mechanisms are also discussed. In IP-over-WDM networks, with upcoming 100 Gbps and beyond, dedicated protection will induce significant under-utilization of backup resources. We investigate design strategies to loan idle circuit backup capacity to support IP/packet services. However, failure of backup circuits will

  15. Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Blaes, Brent R. (Inventor); Nixon, Robert H. (Inventor); Soli, George A. (Inventor)

    1995-01-01

    A method for predicting the SEU susceptibility of a standard-cell D-latch using an alpha-particle sensitive SRAM, SPICE critical charge simulation results, and alpha-particle interaction physics. A technique utilizing test structures to quickly and inexpensively characterize the SEU sensitivity of standard cell latches intended for use in a space environment. This bench-level approach utilizes alpha particles to induce upsets in a low LET sensitive 4-k bit test SRAM. This SRAM consists of cells that employ an offset voltage to adjust their upset sensitivity and an enlarged sensitive drain junction to enhance the cell's upset rate.

  16. A Novel Picosecond Pulse Generation Circuit Based on SRD and NLTL.

    PubMed

    Zhou, Jianming; Lu, Qiuyuan; Liu, Fan; Li, Yinqiao

    2016-01-01

    Because of the importance of ultra-wideband (UWB) radar in various applications, short pulse generation in UWB systems has attracted a lot of attention in recent years. In order to shorten the pulse, nonlinear transmission line (NLTL) is imported, which expands the application of step recovery diode (SRD) for pulse generation. Detailed analysis and equations for this SRD and NLTL-based pulse generation are provided and verified by simulation and experimental results. Factors that could cause pulse waveform distortions are also analyzed. The generator circuit presented in this paper generates 130ps and 3.3V pulse, which can be used in UWB radar systems that require sub-nanosecond pulses. PMID:26919290

  17. A Novel Picosecond Pulse Generation Circuit Based on SRD and NLTL

    PubMed Central

    Zhou, Jianming; Lu, Qiuyuan; Liu, Fan; Li, Yinqiao

    2016-01-01

    Because of the importance of ultra-wideband (UWB) radar in various applications, short pulse generation in UWB systems has attracted a lot of attention in recent years. In order to shorten the pulse, nonlinear transmission line (NLTL) is imported, which expands the application of step recovery diode (SRD) for pulse generation. Detailed analysis and equations for this SRD and NLTL-based pulse generation are provided and verified by simulation and experimental results. Factors that could cause pulse waveform distortions are also analyzed. The generator circuit presented in this paper generates 130ps and 3.3V pulse, which can be used in UWB radar systems that require sub-nanosecond pulses. PMID:26919290

  18. Development of a Novel Test Method for On-Demand Internal Short Circuit in a Li-Ion Cell (Presentation)

    SciTech Connect

    Keyser, M.; Long, D.; Jung, Y. S.; Pesaran, A.; Darcy, E.; McCarthy, B.; Patrick, L.; Kruger, C.

    2011-01-01

    This presentation describes a cell-level test method that simulates an emergent internal short circuit, produces consistent and reproducible test results, can establish the locations and temperatures/power/SOC conditions where an internal short circuit will result in thermal runaway, and provides relevant data to validate internal short circuit models.

  19. Electronic load for testing power generating devices

    NASA Technical Reports Server (NTRS)

    Friedman, E. B.; Stepfer, G.

    1968-01-01

    Instrument tests various electric power generating devices by connecting the devices to the input of the load and comparing their outputs with a reference voltage. The load automatically adjusts until voltage output of the power generating device matches the reference.

  20. Addressable Inverter Matrix Tests Integrated-Circuit Wafer

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.

    1988-01-01

    Addressing elements indirectly through shift register reduces number of test probes. With aid of new technique, complex test structure on silicon wafer tested with relatively small number of test probes. Conserves silicon area by reduction of area devoted to pads. Allows thorough evaluation of test structure characteristics and of manufacturing process parameters. Test structure consists of shift register and matrix of inverter/transmission-gate cells connected to two-by-ten array of probe pads. Entire pattern contained in square area having only 1.6-millimeter sides. Shift register is conventional static CMOS device using inverters and transmission gates in master/slave D flip-flop configuration.

  1. Design and testing of an active quenching circuit for an avalanche photodiode photon detector

    NASA Technical Reports Server (NTRS)

    Arbel, D.; Schwartz, J. A.

    1991-01-01

    The photon-detection capabilities of avalanche photodiodes (APDs) operating above their theoretical breakdown voltages are described, with particular attention given to the needs and methods of quenching an avalanche once breakdown has occurred. A brief background on the motives of and previous work with this mode of operation is presented. Finally, a description of the design and testing of an active quenching circuit is given. Although the active quenching circuit did not perform as expected, knowledge was gained as to the signal amplitudes necessary for quenching and the need for a better model for the above-breakdown circuit characteristics of the Geiger-mode APD.

  2. Molten-Caustic-Leaching (MCL or Gravimelt) System Integration Project. Topical report for test circuit operation

    SciTech Connect

    Not Available

    1990-11-01

    This is a report of the results obtained from the operation of an integrated test circuit for the Molten-Caustic-Leaching (MCL or Gravimelt) process for the desulfurization and demineralization of coal. The objectives of operational testing of the 20 pounds of coal per hour integrated MCL test circuit are: (1) to demonstrate the technical capability of the process for producing a demineralized and desulfurized coal that meets New Source Performance Standards (NSPS); (2) to determine the range of effective process operation; (3) to test process conditions aimed at significantly lower costs; and (4) to deliver product coal.

  3. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1992-01-01

    A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Temperature definition and vibration tests are performed next. Final assembly testing is performed to simulate the Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation. Verification is successful when all components and final assemblies have passed each test. This method was very successful in verifying that commercial printed-circuit boards will survive in the Shuttle environment.

  4. Modifications to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIp, provided by Idaho National Laboratory (INL), is the subject of the first round ofexperimentation. This paper provides a summary of the tests conducted on the original circuit, details the physical changes that have since been made to it, and describes the current test program.

  5. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED.

    PubMed

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-01-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit. PMID:27562055

  6. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED

    PubMed Central

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-01-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit. PMID:27562055

  7. F-1 Engine Gas Generator Testing

    NASA Video Gallery

    The gas generator from an F-1 engine is test-fired at the Marshall Space Flight Center in Huntsville, Ala., on Jan. 24, 2013. Data from the 30 second test will be used in the development of advance...

  8. Analysis of Distribution Circuits with High Penetrations of Photo-Voltaic Generation and Progressive Steps to Enable Higher Penetrations

    NASA Astrophysics Data System (ADS)

    Payne, Joshua Daniel

    Concern for anthropogenic climate change has instigated an increase in renewable generation capacity, including photo-voltaic (PV) power generation in distribution circuits. Distribution circuits with relatively high penetrations of PV generation (High-Pen PV) exist today, but how much more generation can distribution systems handle? This research aims to approach this question by 1) analyzing and quantifying High-Pen PV limitations on the primary circuits of distribution systems and 2) propose and analyze progressive steps to enable higher penetrations of PV on distribution circuits. Utilizing connectivity and load demand measurements provided by Pacific Gas & Electric (PG&E), time-resolved three-phase balanced feeder models of a commercial and a residential circuit featuring High-Pen PV were developed and calibrated to the point of the sub-station. Once calibrated, the circuit performance was simulated with varying PV penetrations and spatial distributions for typical seasonal high and seasonal low load demand days. Circuit scenarios with the Generation Center located downstream of the Load Center and with high impedance distribution line in-between lead to high voltage conditions. High-Pen PV interacting with the sub-station Load Drop Compensation (LDC) resulted an increased number of equipment operations and low voltage conditions on the circuit. As PV penetration increased, sub-station power factor and line loss decreased until reverse power flow became dominant. These were observed characteristics of High-Pen PV circuits. To overcome the limitations stated above, practical steps, such as line re-conductoring, and progressive control and operation changes were introduced. The progressive changes included using a Voltage Rise Siting (VRS) score for planning and LDC Current Compensation control to enable higher penetrations of PV. It was shown that limitations of High-Pen PV on the primary side of distribution circuits may be overcome via these practical and

  9. Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

    NASA Technical Reports Server (NTRS)

    Garber, A.; Godfroy, T.; Webster, K.

    2007-01-01

    Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  10. Life test of a nickel cadmium battery with a protection/reconditioning circuit

    NASA Technical Reports Server (NTRS)

    Lanier, J. R., Jr.; Bush, J. R., Jr.

    1981-01-01

    Results are discussed for a Ni-Cd battery test over a period of 8 years, 2 months and 44,213 simulated low Earth orbits. The battery cells were protected against overdischarge and reversal at discharge rates up to 25 amperes (1.25C) by a battery protection and reconditioning circuit. The circuit performed flawlessly during the test, and proved its value, both as a battery reconditioner and a cell protection device. Battery cell failures are also discussed. The test demonstrated the viability of using Ni-Cd batteries at depth-of-discharge up to 25 percent for over 5 years in a low Earth orbit.

  11. 4H-SiC JFET Multilayer Integrated Circuit Technologies Tested Up to 1000 K

    NASA Technical Reports Server (NTRS)

    Spry, D. J.; Neudeck, P. G.; Chen, L.; Chang, C. W.; Lukco, D.; Beheim, G. M.

    2015-01-01

    Testing of semiconductor electronics at temperatures above their designed operating envelope is recognized as vital to qualification and lifetime prediction of circuits. This work describes the high temperature electrical testing of prototype 4H silicon carbide (SiC) junction field effect transistor (JFET) integrated circuits (ICs) technology implemented with multilayer interconnects; these ICs are intended for prolonged operation at temperatures up to 773K (500 C). A 50 mm diameter sapphire wafer was used in place of the standard NASA packaging for this experiment. Testing was carried out between 300K (27 C) and 1150K (877 C) with successful electrical operation of all devices observed up to 1000K (727 C).

  12. Revised evaluation of steam generator testing alternatives

    SciTech Connect

    1981-01-01

    A scoping evaluation was made of various facility alternatives for test of LMFBR prototype steam generators and models. Recommendations are given for modifications to EBR-II and SCTI (Sodium Components Test Installation) for prototype SG testing, and for few-tube model testing. (DLC)

  13. Development of a Three-Tier Test to Assess Misconceptions about Simple Electric Circuits

    ERIC Educational Resources Information Center

    Pesman, Haki; Eryilmaz, Ali

    2010-01-01

    The authors aimed to propose a valid and reliable diagnostic instrument by developing a three-tier test on simple electric circuits. Based on findings from the interviews, open-ended questions, and the related literature, the test was developed and administered to 124 high school students. In addition to some qualitative techniques for…

  14. Mechanisms of Left-Right Coordination in Mammalian Locomotor Pattern Generation Circuits: A Mathematical Modeling View

    PubMed Central

    Talpalar, Adolfo E.; Rybak, Ilya A.

    2015-01-01

    The locomotor gait in limbed animals is defined by the left-right leg coordination and locomotor speed. Coordination between left and right neural activities in the spinal cord controlling left and right legs is provided by commissural interneurons (CINs). Several CIN types have been genetically identified, including the excitatory V3 and excitatory and inhibitory V0 types. Recent studies demonstrated that genetic elimination of all V0 CINs caused switching from a normal left-right alternating activity to a left-right synchronized “hopping” pattern. Furthermore, ablation of only the inhibitory V0 CINs (V0D subtype) resulted in a lack of left-right alternation at low locomotor frequencies and retaining this alternation at high frequencies, whereas selective ablation of the excitatory V0 neurons (V0V subtype) maintained the left–right alternation at low frequencies and switched to a hopping pattern at high frequencies. To analyze these findings, we developed a simplified mathematical model of neural circuits consisting of four pacemaker neurons representing left and right, flexor and extensor rhythm-generating centers interacting via commissural pathways representing V3, V0D, and V0V CINs. The locomotor frequency was controlled by a parameter defining the excitation of neurons and commissural pathways mimicking the effects of N-methyl-D-aspartate on locomotor frequency in isolated rodent spinal cord preparations. The model demonstrated a typical left-right alternating pattern under control conditions, switching to a hopping activity at any frequency after removing both V0 connections, a synchronized pattern at low frequencies with alternation at high frequencies after removing only V0D connections, and an alternating pattern at low frequencies with hopping at high frequencies after removing only V0V connections. We used bifurcation theory and fast-slow decomposition methods to analyze network behavior in the above regimes and transitions between them. The model

  15. Mechanisms of left-right coordination in mammalian locomotor pattern generation circuits: a mathematical modeling view.

    PubMed

    Molkov, Yaroslav I; Bacak, Bartholomew J; Talpalar, Adolfo E; Rybak, Ilya A

    2015-05-01

    The locomotor gait in limbed animals is defined by the left-right leg coordination and locomotor speed. Coordination between left and right neural activities in the spinal cord controlling left and right legs is provided by commissural interneurons (CINs). Several CIN types have been genetically identified, including the excitatory V3 and excitatory and inhibitory V0 types. Recent studies demonstrated that genetic elimination of all V0 CINs caused switching from a normal left-right alternating activity to a left-right synchronized "hopping" pattern. Furthermore, ablation of only the inhibitory V0 CINs (V0D subtype) resulted in a lack of left-right alternation at low locomotor frequencies and retaining this alternation at high frequencies, whereas selective ablation of the excitatory V0 neurons (V0V subtype) maintained the left-right alternation at low frequencies and switched to a hopping pattern at high frequencies. To analyze these findings, we developed a simplified mathematical model of neural circuits consisting of four pacemaker neurons representing left and right, flexor and extensor rhythm-generating centers interacting via commissural pathways representing V3, V0D, and V0V CINs. The locomotor frequency was controlled by a parameter defining the excitation of neurons and commissural pathways mimicking the effects of N-methyl-D-aspartate on locomotor frequency in isolated rodent spinal cord preparations. The model demonstrated a typical left-right alternating pattern under control conditions, switching to a hopping activity at any frequency after removing both V0 connections, a synchronized pattern at low frequencies with alternation at high frequencies after removing only V0D connections, and an alternating pattern at low frequencies with hopping at high frequencies after removing only V0V connections. We used bifurcation theory and fast-slow decomposition methods to analyze network behavior in the above regimes and transitions between them. The model

  16. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  17. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  18. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  19. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  20. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  1. Description and test results of a variable speed, constant frequency generating system

    NASA Technical Reports Server (NTRS)

    Brady, F. J.

    1985-01-01

    The variable-speed, constant frequency generating system developed for the Mod-0 wind turbine is presented. This report describes the system as it existed at the conclusion of the project. The cycloconverter control circuit is described including the addition of field-oriented control. The laboratory test and actual wind turbine test results are included.

  2. Generating Test Templates via Automated Theorem Proving

    NASA Technical Reports Server (NTRS)

    Kancherla, Mani Prasad

    1997-01-01

    Testing can be used during the software development process to maintain fidelity between evolving specifications, program designs, and code implementations. We use a form of specification-based testing that employs the use of an automated theorem prover to generate test templates. A similar approach was developed using a model checker on state-intensive systems. This method applies to systems with functional rather than state-based behaviors. This approach allows for the use of incomplete specifications to aid in generation of tests for potential failure cases. We illustrate the technique on the cannonical triangle testing problem and discuss its use on analysis of a spacecraft scheduling system.

  3. Integration of MHD load models with circuit representations the Z generator.

    SciTech Connect

    Jennings, Christopher A.; Ampleford, David J.; Jones, Brent Manley; McBride, Ryan D.; Bailey, James E.; Jones, Michael C.; Gomez, Matthew Robert.; Cuneo, Michael Edward; Nakhleh, Charles; Stygar, William A.; Savage, Mark Edward; Wagoner, Timothy C.; Moore, James K.

    2013-03-01

    MHD models of imploding loads fielded on the Z accelerator are typically driven by reduced or simplified circuit representations of the generator. The performance of many of the imploding loads is critically dependent on the current and power delivered to them, so may be strongly influenced by the generators response to their implosion. Current losses diagnosed in the transmission lines approaching the load are further known to limit the energy delivery, while exhibiting some load dependence. Through comparing the convolute performance of a wide variety of short pulse Z loads we parameterize a convolute loss resistance applicable between different experiments. We incorporate this, and other current loss terms into a transmission line representation of the Z vacuum section. We then apply this model to study the current delivery to a wide variety of wire array and MagLif style liner loads.

  4. Mobile testing complex based on an explosive magnetic generator

    NASA Astrophysics Data System (ADS)

    Shurupov, A. V.; Kozlov, A. V.; Gusev, A. N.; Shurupova, N. P.; Zavalova, V. E.; Chulkov, A. N.; Bazelyan, E. M.

    2015-01-01

    A mobile testing complex prototype on the basis of an explosive magnetic generator (MTC EMG) is developed to simulate a lightning current pulse. The main element of this complex is a current pulse generator comprising a EMG with a pulse transformer for energy release into the load. The electric chain of the MTC EMG is theoretically analyzed taking into consideration energy losses in active resistances in the primary circuit of the transformer and the inductive-resistive nature of the load, which resulted in the minimization of energy losses in the primary circuit depending on the electric chain parameters. It was found that, if the energy losses are minimized, the efficiency of transferring the EMG energy into the load exceeds 50%. As a result of the field tests of the MTC EMG, its basic characteristics were determined and the waveforms of the current pulses and voltages in the load were obtained. It is shown that the results of the mathematical simulation of current pulses in the load are in good agreement with the experimental data.

  5. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1991-01-01

    A method is discussed developed to verify commercial printed-circuit boards for a shuttle orbital flight. The Space Acceleration Measurement System Project used this method first with great success. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Then temperature definition tests are performed that consist of infrared scanning, thermal vacuum testing, and preliminary thermal operational testing. Only the engineering unit is used for temperature definition testing, but the preliminary thermal operational testing is performed on the flight unit after the temperature range has been defined. In the sequence of testing, vibration testing is performed next, but most vibration failures cannot be detected without subsequent temperature cycling. Finally, final assembly testing is performed to simulate the shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 hours of trouble-free operation. Verification is successful when all components and final assemblies have passed each test satisfactory. This method was very successful in verifying that commercial printed-circuit boards will survive in the shuttle environment.

  6. Assessing the SEU resistance of CMOS latches using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M.; Blaes, B.; Nixon, R.

    1990-01-01

    The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environment is evident in the upset rate of the Tracking and Data Relay Satellite (TDRS) launched in Apr. 1983. This satellite experiences a single-event-upset (SEU) per day which must be corrected from the ground. Such experience caused a redesign of the Galileo spacecraft with SEU resistant IC's. The solution to the SEU problem continues to be important as the complexity of spacecraft grows, the feature size of IC's decreases, and as space systems are designed with circuits fabricated at non-radiation hardened foundries. This paper describes an approach for verifying the susceptibility of CMOS latches to heavy-ion induced state changes. The approach utilizes alpha particles to induce the upsets in test circuits. These test circuits are standard cells that have offset voltages which sensitize the circuits to upsets. These results are then used to calculate the upsetability at operating voltages. In this study results are presented for the alpha particle upset of a six-transistor static random access memory (SRAM) cell. Then a methodology is described for the analysis of a standard-cell inverter latch.

  7. Testing of Diode-Clamping in an Inductive Pulsed Plasma Thruster Circuit

    NASA Technical Reports Server (NTRS)

    Toftul, Alexandra; Polzin, Kurt A.; Martin, Adam K.; Hudgins, Jerry L.

    2014-01-01

    Testing of a 5.5 kV silicon (Si) diode and 5.8 kV prototype silicon carbide (SiC) diode in an inductive pulsed plasma thruster (IPPT) circuit was performed to obtain a comparison of the resulting circuit recapture efficiency,eta(sub r), defined as the percentage of the initial charge energy remaining on the capacitor bank after the diode interrupts the current. The diode was placed in a pulsed circuit in series with a silicon controlled rectifier (SCR) switch, and the voltages across different components and current waveforms were collected over a range of capacitor charge voltages. Reverse recovery parameters, including turn-off time and peak reverse recovery current, were measured and capacitor voltage waveforms were used to determine the recapture efficiency for each case. The Si fast recovery diode in the circuit was shown to yield a recapture efficiency of up to 20% for the conditions tested, while the SiC diode further increased recapture efficiency to nearly 30%. The data presented show that fast recovery diodes operate on a timescale that permits them to clamp the discharge quickly after the first half cycle, supporting the idea that diode-clamping in IPPT circuit reduces energy dissipation that occurs after the first half cycle

  8. Self-testing quantum random number generator.

    PubMed

    Lunghi, Tommaso; Brask, Jonatan Bohr; Lim, Charles Ci Wen; Lavigne, Quentin; Bowles, Joseph; Martin, Anthony; Zbinden, Hugo; Brunner, Nicolas

    2015-04-17

    The generation of random numbers is a task of paramount importance in modern science. A central problem for both classical and quantum randomness generation is to estimate the entropy of the data generated by a given device. Here we present a protocol for self-testing quantum random number generation, in which the user can monitor the entropy in real time. Based on a few general assumptions, our protocol guarantees continuous generation of high quality randomness, without the need for a detailed characterization of the devices. Using a fully optical setup, we implement our protocol and illustrate its self-testing capacity. Our work thus provides a practical approach to quantum randomness generation in a scenario of trusted but error-prone devices. PMID:25933297

  9. Self-Testing Quantum Random Number Generator

    NASA Astrophysics Data System (ADS)

    Lunghi, Tommaso; Brask, Jonatan Bohr; Lim, Charles Ci Wen; Lavigne, Quentin; Bowles, Joseph; Martin, Anthony; Zbinden, Hugo; Brunner, Nicolas

    2015-04-01

    The generation of random numbers is a task of paramount importance in modern science. A central problem for both classical and quantum randomness generation is to estimate the entropy of the data generated by a given device. Here we present a protocol for self-testing quantum random number generation, in which the user can monitor the entropy in real time. Based on a few general assumptions, our protocol guarantees continuous generation of high quality randomness, without the need for a detailed characterization of the devices. Using a fully optical setup, we implement our protocol and illustrate its self-testing capacity. Our work thus provides a practical approach to quantum randomness generation in a scenario of trusted but error-prone devices.

  10. New reconstruction method for x-ray testing of multilayer printed circuit board

    NASA Astrophysics Data System (ADS)

    Yang, Min; Wang, Gao; Liu, Yongzhan

    2010-05-01

    For multilayer printed circuit board (PCB) and large-scale integrated circuit (LIC) chips, nondestructive testing of the inner structure and welding defects is very important for circuit diagram reverse design and manufacturing quality control. The traditional nondestructive testing of this kind of plate-like object is digital radiography (DR), which can provide only images with overlapped information, so it is difficult to get a full and accurate circuit image of every layer and the position of the defects using the DR method. At the same time, traditional computed tomography scanning methods are also unable to resolve this problem. A new reconstruction method is proposed for the nondestructive testing of plate-like objects. With this method, x rays irradiate the surface of the reconstructed object at an oblique angle, and a series of projection images are obtained while the object is rotating. Then, through a relevant preprocessing method on the projections and a special reconstructing algorithm, cross sections of the scanning region are finally obtained slice by slice. The experimental results prove that this method satisfactorily addresses the challenges of nondestructive testing of plate-like objects such as PCB or LIC.

  11. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Service time test; open-circuit apparatus. 84.95 Section 84.95 Public Health PUBLIC HEALTH SERVICE, DEPARTMENT OF HEALTH AND HUMAN SERVICES OCCUPATIONAL SAFETY AND HEALTH RESEARCH AND RELATED ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.95 Service...

  12. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; closed-circuit apparatus. 84.94 Section 84.94 Public Health PUBLIC HEALTH SERVICE, DEPARTMENT OF HEALTH AND HUMAN SERVICES OCCUPATIONAL SAFETY AND HEALTH RESEARCH AND RELATED ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.94 Gas flow...

  13. The thermoelectric generator test program at JPL.

    NASA Technical Reports Server (NTRS)

    Stapfer, G.; Rouklove, P.

    1972-01-01

    Discussion of the test results and analysis performed on data obtained from eight thermoelectric generators exhibiting a total combined operating time of about 21 years. Three (3) SNAP-19 type generators are discussed. Generator SN-20, the engineering model of the units presently operating on the Nimbus S/C, has been in operation for over 4 years and has shown drastic degradation after losing the internal cover gas. Generator SN-21, with more than four years of operating time, is operated in an air environment. The performance of this generator appears predictable and stable. For the last 2 years of operation generator degradation has been negligible. Generator SN-31, which utilizes the TAGS material for the P thermoelectric leg, is similar in design to the units to be used on the Pioneer S/C and has operated for over two years in an all-argon atmosphere.

  14. Using Test Generating Software for Assessment

    NASA Astrophysics Data System (ADS)

    Singh Aurora, Tarlok

    2007-04-01

    Assessment is an important part of teaching and learning. Designing suitable tests and quizzes for assessment is a time consuming task. With faculty's much commitment at work, sometimes it is not easy to find enough time to design a good test before the test day. Searching for and modifying older tests can take considerable amount of time. There is a need to develop a customized test bank that one could use to generate a quiz or test quickly before class time or before a test. A number of commercial software is available for e-learning that has this capability. Some of these are - Test Generator, Examview, Test Pro Developer etc. Application of Examview software in developing a test bank for physics will be presented. A physics test bank, with applications in other disciplines, can be gradually built over time and used to create a test or quiz quickly. Multiple scrambled versions of a single test (and answer sheets) can be created to discourage cheating in a large class setting. The presentation will show how to build a test bank.

  15. Development of a stereo-symmetrical nanosecond pulsed power generator composed of modularized avalanche transistor Marx circuits

    NASA Astrophysics Data System (ADS)

    Li, Jiang-Tao; Zhong, Xu; Cao, Hui; Zhao, Zheng; Xue, Jing; Li, Tao; Li, Zheng; Wang, Ya-Nan

    2015-09-01

    Avalanche transistors have been widely studied and used in nanosecond high voltage pulse generations. However, output power improvement is always limited by the low thermal capacities of avalanche transistors, especially under high repetitive working frequency. Parallel stacked transistors can effectively improve the output current but the controlling of trigger and output synchronism has always been a hard and complex work. In this paper, a novel stereo-symmetrical nanosecond pulsed power generator with high reliability was developed. By analyzing and testing the special performances of the combined Marx circuits, numbers of meaningful conclusions on the pulse amplitude, pulse back edge, and output impedance were drawn. The combining synchronism of the generator was confirmed excellent and lower conducting current through the transistors was realized. Experimental results showed that, on a 50 Ω resistive load, pulses with 1.5-5.2 kV amplitude and 5.3-14.0 ns width could be flexibly generated by adjusting the number of combined modules, the supply voltage, and the module type.

  16. Development of a stereo-symmetrical nanosecond pulsed power generator composed of modularized avalanche transistor Marx circuits.

    PubMed

    Li, Jiang-Tao; Zhong, Xu; Cao, Hui; Zhao, Zheng; Xue, Jing; Li, Tao; Li, Zheng; Wang, Ya-Nan

    2015-09-01

    Avalanche transistors have been widely studied and used in nanosecond high voltage pulse generations. However, output power improvement is always limited by the low thermal capacities of avalanche transistors, especially under high repetitive working frequency. Parallel stacked transistors can effectively improve the output current but the controlling of trigger and output synchronism has always been a hard and complex work. In this paper, a novel stereo-symmetrical nanosecond pulsed power generator with high reliability was developed. By analyzing and testing the special performances of the combined Marx circuits, numbers of meaningful conclusions on the pulse amplitude, pulse back edge, and output impedance were drawn. The combining synchronism of the generator was confirmed excellent and lower conducting current through the transistors was realized. Experimental results showed that, on a 50 Ω resistive load, pulses with 1.5-5.2 kV amplitude and 5.3-14.0 ns width could be flexibly generated by adjusting the number of combined modules, the supply voltage, and the module type. PMID:26429438

  17. MYSID TWO-GENERATION TEST GUIDELINE

    EPA Science Inventory

    McKenney, Charles L., Jr. In press. Mysid Two-Generation Test Guideline. OECD Expert Group on Invertebrate Testing for Endocrine Disruptors, Organisation for Economic Co-operation and Development, Paris, France. 17 p. (ERL,GB 1215).

    This guideline describes a two-generati...

  18. Testing and Troubleshooting Automatically Generated Source Code

    NASA Technical Reports Server (NTRS)

    Henry, Joel

    1998-01-01

    Tools allowing engineers to model the real-time behavior of systems that control many types of NASA systems have become widespread. These tools automatically generate source code that is compiled, linked, then downloaded into computers controlling everything from wind tunnels to space flight systems. These tools save hundreds of hours of software development time and allow engineers with thorough application area knowledge but little software development experience to generate software to control the systems they use daily. These systems are verified and validated by simulating the real-time models, and by other techniques that focus on the model or the hardware. The automatically generated source code is typically not subjected to rigorous testing using conventional software testing techniques. Given the criticality and safety issues surrounding these systems, the application of conventional and new software testing and troubleshooting techniques to the automatically generated will improve the reliability of the resulting systems.

  19. Molten-Caustic-Leaching (Gravimelt) System Integration Project, Phase 2. Topical report for test circuit operation

    SciTech Connect

    Not Available

    1993-02-01

    The objective of the task (Task 6) covered in this document was to operate the refurbished/modified test circuit of the Gravimeh Process in a continuous integrated manner to obtain the engineering and operational data necessary to assess the technical performance and reliability of the circuit. This data is critical to the development of this technology as a feasible means of producing premium clean burning fuels that meet New Source Performance Standards (NSPS). Significant refurbishments and design modifications had been made to the facility (in particular to the vacuum filtration and evaporation units) during Tasks 1 and 2, followed by off-line testing (Task 3). Two weeks of continuous around-the-clock operation of the refurbished/modified MCL test circuit were performed. During the second week of testing, all sections of the plant were operated in an integrated fashion for an extended period of time, including a substantial number of hours of on-stream time for the vacuum filters and the caustic evaporation unit. A new process configuration was tested in which centrate from the acid wash train (without acid addition) was used as the water makeup for the water wash train, thus-eliminating the one remaining process waste water stream. A 9-inch centrifuge was tested at various solids loadings and at flow rates up to 400 lbs/hr of coal feed to obtain a twenty-fold scaleup factor over the MCL integrated test facility centrifuge performance data.

  20. Alcohol LOX Steam Generator Test Experience

    NASA Astrophysics Data System (ADS)

    Schaefer, K.; Dommers, M.

    2004-10-01

    At the DLR test centre in Lampoldshausen there is a long experience in the development of rocket steam generators as a main subsystem for the altitude simulation. The rocket steam generators make it possible to supply the required quantities of steam at short notice with reduced investment and operating costs. The rocket steam generators are based on the combustion of liquid oxygen (LOX) and ethyl alcohol (ALC). The paper deals with the experience of the development of the steam generators and the operation at the altitude simulation P1.0 for satellite propulsion and P4.2 for altitude simulation of AESTUS upper stage engine.

  1. A miniature microcontroller curve tracing circuit for space flight testing transistors.

    PubMed

    Prokop, N; Greer, L; Krasowski, M; Flatico, J; Spina, D

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results. PMID:25725870

  2. Modifications and Modeling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. Data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  3. Recent Updates to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIP, provided by Idaho National Laboratory (1NL), is the subject of the first round of experimentation. This presentation details the physical changes made to the FSP-PTC and the current test program.

  4. Formal methods for test case generation

    NASA Technical Reports Server (NTRS)

    Rushby, John (Inventor); De Moura, Leonardo Mendonga (Inventor); Hamon, Gregoire (Inventor)

    2011-01-01

    The invention relates to the use of model checkers to generate efficient test sets for hardware and software systems. The method provides for extending existing tests to reach new coverage targets; searching *to* some or all of the uncovered targets in parallel; searching in parallel *from* some or all of the states reached in previous tests; and slicing the model relative to the current set of coverage targets. The invention provides efficient test case generation and test set formation. Deep regions of the state space can be reached within allotted time and memory. The approach has been applied to use of the model checkers of SRI's SAL system and to model-based designs developed in Stateflow. Stateflow models achieving complete state and transition coverage in a single test case are reported.

  5. Controllable high-fidelity quantum state transfer and entanglement generation in circuit QED

    PubMed Central

    Xu, Peng; Yang, Xu-Chen; Mei, Feng; Xue, Zheng-Yuan

    2016-01-01

    We propose a scheme to realize controllable quantum state transfer and entanglement generation among transmon qubits in the typical circuit QED setup based on adiabatic passage. Through designing the time-dependent driven pulses applied on the transmon qubits, we find that fast quantum sate transfer can be achieved between arbitrary two qubits and quantum entanglement among the qubits also can also be engineered. Furthermore, we numerically analyzed the influence of the decoherence on our scheme with the current experimental accessible systematical parameters. The result shows that our scheme is very robust against both the cavity decay and qubit relaxation, the fidelities of the state transfer and entanglement preparation process could be very high. In addition, our scheme is also shown to be insensitive to the inhomogeneous of qubit-resonator coupling strengths. PMID:26804326

  6. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, J. A., Jr.

    1998-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional (3-D) electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

  7. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1998-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional (3-D) electromagnetic computer code, MAxwell's equations by the Finite Integration Algorithm (MAFIA). Cold-test parameters have been calculated for several helical traveLing-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making It possible, for the first time, to design complete TWT via computer simulation.

  8. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

  9. Design of parity generator and checker circuit using electro-optic effect of Mach-Zehnder interferometers

    NASA Astrophysics Data System (ADS)

    Kumar, Santosh; Chanderkanta; Amphawan, Angela

    2016-04-01

    Parity is an extra bit which is used to add in digital information to detect error at the receiver end. It can be even and odd parity. In case of even parity, the number of one's will be even included the parity and reverse in the case of odd parity. The circuit which is used to generate the parity at the transmitter side, called the parity generator and the circuit which is used to detect the parity at receiver side is called as parity checker. In this paper, an even and odd parity generator and checker circuits are designed using electro-optic effect inside lithium niobate based Mach-Zehnder Interferometers (MZIs). The MZIs structures collectively show powerful capability in switching an input optical signal to a desired output port from a collection of output ports. The paper constitutes a mathematical description of the proposed device and thereafter simulation using MATLAB. The study is verified using beam propagation method (BPM).

  10. Downhole steam generator subject of Sandia tests

    SciTech Connect

    Not Available

    1981-05-01

    The first field test of a down-hole steam generator developed to inject hot steam directly into deeply buried heavy oil reservoirs began in mid-April near Long Beach, CA. The 23-ft-long, 6-in.-diameter generator, developed by Sandia National Laboratories, will produce up to 800 cu ft of 500 F steam a minute (1.2 MW thermal) at the bottom of a 2500-ft well. Goals of the test are to demonstrate the feasibility of operating the generator at realistic depths and to determine its overall performance and environmental impact. Development of the generator is part of the US Department of Energy's Project Deep Steam to identify techniques for recovering heavy oil from deeply buried (greater than 2500 ft) reservoirs.

  11. Test structures for propagation delay measurements on high-speed integrated circuits

    NASA Technical Reports Server (NTRS)

    Long, S. I.

    1984-01-01

    The accuracy of high-speed wafer-level measurements on digital IC's is limited by the probe interface. This limitation strongly encourages the use of built-in on-chip test hardware to reduce the number of critical off-chip high-speed interfaces. A novel synchronous propagation delay test structure is described which will provide accurate parametric data under typical automatic test conditions. Built-in test features added to complex combinational circuits are shown which are useful for delay measurement and which reduce the total number of high-speed I/O connections while still providing acceptable fault coverage in many cases.

  12. ADDER CIRCUIT

    DOEpatents

    Jacobsohn, D.H.; Merrill, L.C.

    1959-01-20

    An improved parallel addition unit is described which is especially adapted for use in electronic digital computers and characterized by propagation of the carry signal through each of a plurality of denominationally ordered stages within a minimum time interval. In its broadest aspects, the invention incorporates a fast multistage parallel digital adder including a plurality of adder circuits, carry-propagation circuit means in all but the most significant digit stage, means for conditioning each carry-propagation circuit during the time period in which information is placed into the adder circuits, and means coupling carry-generation portions of thc adder circuit to the carry propagating means.

  13. Surface Degradation of Ag/W Circuit Breaker Contacts During Standardized UL Testing

    NASA Astrophysics Data System (ADS)

    Yu, Haibo; Sun, Yu; Kesim, M. Tumerkan; Harmon, Jason; Potter, Jonathan; Alpay, S. Pamir; Aindow, Mark

    2015-09-01

    The near-surface microstructure of Ag/W contacts from 120 V, 30 A commercial circuit breakers in the as-manufactured condition and after standardized UL overload/temperature-rise, endurance, and short-circuit testing have been investigated using a combination of x-ray diffraction, scanning electron microscopy, energy-dispersive x-ray spectroscopy, focused ion beam milling, and transmission electron microscopy. The as-manufactured contacts comprised three constituents: sintered Ag/W composite particles with fine-grained Ag and coarse-grained W, coarse-grained pockets of Ag infiltrate, and a nano-crystalline surface Ag layer. There are also WO3 and Ag2O phases at the surface. After UL overload/temperature-rise testing, there is Ag loss giving a porous W-rich layer at the contact surface. In addition to binary oxides, we observe the formation of Ag2WO4. After UL endurance testing, material is swept across the surface by the breaker action giving a W-rich eroded porous surface on one side and a build-up of mixed oxides on the other. After UL short-circuit testing, a W crust forms due to melting and re-solidification of W and vaporization of Ag, and mid-plane cracks form due to the severe thermal gradients. There is a strong correlation between the observed microstructural features and the contact resistance measurements obtained from these samples.

  14. Next Generation Drivetrain Development and Test Program

    SciTech Connect

    Keller, Jonathan; Erdman, Bill; Blodgett, Doug; Halse, Chris; Grider, Dave

    2015-11-03

    This presentation was given at the Wind Energy IQ conference in Bremen, Germany, November 30 through December 2, 2105. It focused on the next-generation drivetrain architecture and drivetrain technology development and testing (including gearbox and inverter software and medium-voltage inverter modules.

  15. Computer-Based Arithmetic Test Generation

    ERIC Educational Resources Information Center

    Trocchi, Robert F.

    1973-01-01

    The computer can be a welcome partner in the instructional process, but only if there is man-machine interaction. Man should not compromise system design because of available hardware; the computer must fit the system design for the result to represent an acceptable solution to instructional technology. The Arithmetic Test Generator system fits…

  16. Torque calculation of the asynchronous motor in short-circuit test

    SciTech Connect

    Demski, W.; Szymanski, G.

    1998-09-01

    The paper presents the application of the calculation method of electromagnetic torque for asynchronous motor in short-circuit test. The {rvec A}, {rvec A}-V formulation with a complex notation for time harmonic systems in the finite difference method is used to solve the nonlinear three dimensional problem. The volume Maxwell stress tensor is used for force and torque calculation. The numerical results are compared with measurement.

  17. Temperature distortion generator for turboshaft engine testing

    NASA Technical Reports Server (NTRS)

    Klann, G. A.; Barth, R. L.; Biesiadny, T. J.

    1984-01-01

    The procedures and unique hardware used to conduct an experimental investigation into the response of a small-turboshaft-engine compression system to various hot gas ingestion patterns are presented. The temperature distortion generator described herein uses gaseous hydrogen to create both steady-state and time-variant, or transient, temperature distortion at the engine inlet. The range of transient temperature ramps produced by the distortion generator during the engine tests was from less than 111 deg K/sec (200 deg R/sec) to above 611 deg K/sec (1100 deg R/sec); instantaneous temperatures to 422 deg K (760 deg R) above ambient were generated. The distortion generator was used to document the maximum inlet temperatures and temperature rise rates that the compression system could tolerate before the onset of stall for various circumferential distortions as well as the compressor system response during stall.

  18. Dual stator winding variable speed asynchronous generator: magnetic equivalent circuit with saturation, FEM analysis and experiments

    NASA Astrophysics Data System (ADS)

    Tutelea, L. N.; Muntean, N.; Deaconu, S. I.; Cunţan, C. D.

    2016-02-01

    The authors carried out a theoretical and experimental study of dual stator winding squirrel cage asynchronous generator (DSWA) behaviour in the presence of saturation regime (non-sinusoidal) due to the variable speed operation. The main aims are the determination of the relations of calculating the equivalent parameters of the machine windings, FEM validation of parameters and characteristics with free FEMM 4.2 computing software and the practice experimental tests for verifying them. Issue is limited to three phase range of double stator winding cage-asynchronous generator of small sized powers, the most currently used in the small adjustable speed wind or hydro power plants. The tests were carried out using three-phase asynchronous generator having rated power of 6 [kVA].

  19. Super NiCd Open-Circuit Storage and Low Earth Orbit (LEO) Life Test Evaluation

    NASA Technical Reports Server (NTRS)

    Baer, Jean Marie; Hwang, Warren C.; Ang, Valerie J.; Hayden, Jeff; Rao, Gopalakrishna; Day, John H. (Technical Monitor)

    2002-01-01

    This presentation discusses Air Force tests performed on super NiCd cells to measure their performance under conditions simulating Low Earth Orbit (LEO) conditions. Super NiCd cells offer potential advantages over existing NiCd cell designs including advanced cell design with improved separator material and electrode making processes, but handling and storage requires active charging. These tests conclude that the super NiCd cells support generic Air Force qualifications for conventional LEO missions (up to five years duration) and that handling and storage may not actually require active charging as previously assumed. Topics covered include: Test Plan, Initial Characterization Tests, Open-Circuit Storage Tests, and post storage capacities.

  20. Infrared Thermography as Applied to Thermal Testing of Power Systems Circuit Boards.

    NASA Astrophysics Data System (ADS)

    Miles, Jonathan James

    All operational electronic equipment dissipates some amount of energy in the form of infrared radiation. Faulty electronic components on a printed circuit board can be categorized as hard (functional) or soft (latent functional). Hard faults are those which are detected during a conventional manufacturing electronic test process. Soft failures, in contrast, are those which are undetectable through conventional testing, but which manifest themselves after a product has been placed into service. Such field defective modules ultimately result in operational failure and subsequently enter a manufacturer's costly repair process. While thermal imaging systems are being used increasingly in the electronic equipment industry as a product-testing tool, applications have primarily been limited to product design or repair processes, with minimal use in a volume manufacturing environment. Use of thermal imaging systems in such an environment has mostly been limited to low-volume products or random screening of high-volume products. Thermal measurements taken in a manufacturing environment are often taken manually, thus defeating their capability of rapid data acquisition and constraining their full potential in a high-volume manufacturing process. Integration of a thermal measurement system with automated testing equipment is essential for optimal use of expensive infrared measurement tools in a high-volume manufacturing environment. However, such a marriage presents problems with respect to both existing manufacturing test processes and infrared measurement techniques. Methods are presented in this dissertation to test automatically for latent faults, those which elude detection during conventional electronic testing, on printed circuit boards. These methods are intended for implementation in a volume manufacturing environment and involve the application of infrared imaging tools. Successful incorporation of infrared testing into existing test processes requires that: PASS

  1. Generation of copper rich metallic phases from waste printed circuit boards

    SciTech Connect

    Cayumil, R.; Khanna, R.; Ikram-Ul-Haq, M.; Rajarao, R.; Hill, A.; Sahajwalla, V.

    2014-10-15

    Highlights: • Recycling and material recovery from waste printed circuit boards is very complex. • Thermoset polymers, ceramics and metals are present simultaneously in waste PCBs. • Heat treatment of PCBs was carried out at 1150 °C under inert conditions. • Various metallic phases could be segregated out as copper based metallic droplets. • Carbon and ceramics residues can be further recycled in a range of applications. - Abstract: The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150 °C under argon gas flowing at 1 L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the

  2. A computer test bench for checking and adjusting the automatic regulators of generator excitation systems

    SciTech Connect

    Dovganyuk, I. Ya.; Labunets, I. A.; Plotnikova, T. V.; Sokur, P. V.

    2008-05-15

    A computer test bench for testing and debugging natural samples of the automatic excitation regulation systems of generators, the protection units and the power part of the excitation system is described. The bench includes a personal computer with specialized input-output circuit boards for analog and digital signals, and enables the time and cost involved in developing and checking control systems to be reduced considerably. The program employed operates in real time and enables the automatic excitation regulators of synchronous generators and generators with longitudinal-transverse excitation in a specific power system to be adjusted.

  3. Design and test of a capacitance detection circuit based on a transimpedance amplifier

    NASA Astrophysics Data System (ADS)

    Linfeng, Mu; Wendong, Zhang; Changde, He; Rui, Zhang; Jinlong, Song; Chenyang, Xue

    2015-07-01

    This paper presents a transimpedance amplifier (TIA) capacitance detection circuit aimed at detecting micro-capacitance, which is caused by ultrasonic stimulation applied to the capacitive micro-machined ultrasonic transducer (CMUT). In the capacitance interface, a TIA is adopted to amplify the received signal with a center frequency of 400 kHz, and finally detect ultrasound pressure. The circuit has a strong anti-stray property and this paper also studies the calculation of compensation capacity in detail. To ensure high resolution, noise analysis is conducted. After optimization, the detected minimum ultrasound pressure is 2.1 Pa, which is two orders of magnitude higher than the former. The test results showed that the circuit was sensitive to changes in ultrasound pressure and the distance between the CMUT and stumbling block, which also successfully demonstrates the functionality of the developed TIA of the analog-front-end receiver. Project supported by the National Natural Science Foundation of China (No. 61127008) and the Subsidized Program of the National High Technology Research and Development Program of China (No. 2011AA040404).

  4. Development and Analysis of Cold Trap for Use in Fission Surface Power-Primary Test Circuit

    NASA Technical Reports Server (NTRS)

    Wolfe, T. M.; Dervan, C. A.; Pearson, J. B.; Godfroy, T. J.

    2012-01-01

    The design and analysis of a cold trap proposed for use in the purification of circulated eutectic sodium potassium (NaK-78) loops is presented. The cold trap is designed to be incorporated into the Fission Surface Power-Primary Test Circuit (FSP-PTC), which incorporates a pumped NaK loop to simulate in-space nuclear reactor-based technology using non-nuclear test methodology as developed by the Early Flight Fission-Test Facility. The FSP-PTC provides a test circuit for the development of fission surface power technology. This system operates at temperatures that would be similar to those found in a reactor (500-800 K). By dropping the operating temperature of a specified percentage of NaK flow through a bypass containing a forced circulation cold trap, the NaK purity level can be increased by precipitating oxides from the NaK and capturing them within the cold trap. This would prevent recirculation of these oxides back through the system, which may help prevent corrosion.

  5. Design and test of a robust multi-channel programmable sensor interface circuit for use in extreme environments

    SciTech Connect

    Van Cutsem, K.; De Cock, W.; Tavernier, S.

    2011-07-01

    This article describes the design of a sensor interface circuit for the amplification of voltages and currents. The created PCB was tested at high temperatures and under gamma irradiation. Two different operational amplifiers were compared. (authors)

  6. Thermal hydraulic performance testing of printed circuit heat exchangers in a high-temperature helium test facility

    SciTech Connect

    Sai K. Mylavarapu; Xiaodong Sun; Richard E. Glosup; Richard N. Christensen; Michael W. Patterson

    2014-04-01

    In high-temperature gas-cooled reactors, such as a very high temperature reactor (VHTR), an intermediate heat exchanger (IHX) is required to efficiently transfer the core thermal output to a secondary fluid for electricity generation with an indirect power cycle and/or process heat applications. Currently, there is no proven high-temperature (750–800 °C or higher) compact heat exchanger technology for high-temperature reactor design concepts. In this study, printed circuit heat exchanger (PCHE), a potential IHX concept for high-temperature applications, has been investigated for their heat transfer and pressure drop characteristics under high operating temperatures and pressures. Two PCHEs, each having 10 hot and 10 cold plates with 12 channels (semicircular cross-section) in each plate are fabricated using Alloy 617 plates and tested for their performance in a high-temperature helium test facility (HTHF). The PCHE inlet temperature and pressure were varied from 85 to 390 °C/1.0–2.7 MPa for the cold side and 208–790 °C/1.0–2.7 MPa for the hot side, respectively, while the mass flow rate of helium was varied from 15 to 49 kg/h. This range of mass flow rates corresponds to PCHE channel Reynolds numbers of 950 to 4100 for the cold side and 900 to 3900 for the hot side (corresponding to the laminar and laminar-to-turbulent transition flow regimes). The obtained experimental data have been analyzed for the pressure drop and heat transfer characteristics of the heat transfer surface of the PCHEs and compared with the available models and correlations in the literature. In addition, a numerical treatment of hydrodynamically developing and hydrodynamically fully-developed laminar flow through a semicircular duct is presented. Relations developed for determining the hydrodynamic entrance length in a semicircular duct and the friction factor (or pressure drop) in the hydrodynamic entry length region for laminar flow through a semicircular duct are given. Various

  7. Custom pulse generator for RPC testing

    NASA Astrophysics Data System (ADS)

    Gil, A.; Castro, E.; Díaz, J.; Fonte, P.; Garzón, J. A.; Montes, N.; Zapata, M.

    2009-05-01

    We present a pulse generator able to generate pulses statistically similar to the ones produced by RPC cells. The device generates up to four arrays of fast and narrow random-like pulses. Polarity, maximum amplitudes, widths and pulse rate in each channel may be modified independently in order to simulate different RPC setups and environments. This portable and cost-effective pulse generator is a versatile instrument for testing FE-Electronics and different real detector features related with the signal propagation inside the detector. It has been developed in the framework of the ESTRELA project of the HADES experiment at GSI. ESTRELA (Electrically Shielded Timing RPC Ensemble for Low Angles) is part of the upgrade of the HADES experiment at GSI with the aim of constructing an RPC-based time-of-flight wall that will cover around 8 m 2 in order to cope with the high particle multiplicities expected for heavy nuclei collision systems such as Au+Au.

  8. Spike timing-dependent serotonergic neuromodulation of synaptic strength intrinsic to a central pattern generator circuit.

    PubMed

    Sakurai, Akira; Katz, Paul S

    2003-11-26

    Neuromodulation is often thought to have a static, gain-setting function in neural circuits. Here we report a counter example: the neuromodulatory effect of a serotonergic neuron is dependent on the interval between its spikes and those of the neuron being modulated. The serotonergic dorsal swim interneurons (DSIs) are members of the escape swim central pattern generator (CPG) in the mollusk Tritonia diomedea. DSI spike trains heterosynaptically enhanced synaptic potentials evoked by another CPG neuron, ventral swim interneuron B (VSI-B), when VSI-B action potentials occurred within 10 sec of a DSI spike train; however, if VSI-B was stimulated 20-120 sec after DSI, then the amplitude of VSI-B synaptic potentials decreased. Consistent with this, VSI-B-evoked synaptic currents exhibited a temporally biphasic and bidirectional change in amplitude after DSI stimulation. Both the DSI-evoked enhancement and decrement were occluded by serotonin and blocked by the serotonin receptor antagonist methysergide, suggesting that both phases are mediated by serotonin. In most preparations, however, bath-applied serotonin caused only a sustained enhancement of VSI-B synaptic strength. The heterosynaptic modulation interacted with short-term homosynaptic plasticity: DSI-evoked depression was offset by VSI-B homosynaptic facilitation. This caused a complicated temporal pattern of neuromodulation when DSI and VSI-B were stimulated to fire in alternating bursts to mimic the natural motor pattern: DSI strongly enhanced summated VSI-B synaptic potentials and suppressed single synaptic potentials after the cessation of the artificial motor pattern. Thus, spike timing-dependent serotonergic neuromodulatory actions can impart temporal information that may be relevant to the operation of the CPG. PMID:14645466

  9. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 49 Transportation 4 2013-10-01 2013-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  10. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  11. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  12. BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability. Ph.D. Thesis

    NASA Technical Reports Server (NTRS)

    Chen, Chung-Hsing

    1992-01-01

    In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

  13. Configurable test bed design for nanosats to qualify commercial and customized integrated circuits

    NASA Astrophysics Data System (ADS)

    Guareschi, W.; Azambuja, J.; Kastensmidt, F.; Reis, R.; Durao, O.; Schuch, N.; Dessbesel, G.

    The use of small satellites has increased substantially in recent years due to the reduced cost of their development and launch, as well to the flexibility offered by commercial components. The test bed is a platform that allows components to be evaluated and tested in space. It is a flexible platform, which can be adjusted to a wide quantity of components and interfaces. This work proposes the design and implementation of a test bed suitable for test and evaluation of commercial circuits used in nanosatellites. The development of such a platform allows developers to reduce the efforts in the integration of components and therefore speed up the overall system development time. The proposed test bed is a configurable platform implemented using a Field Programmable Gate Array (FPGA) that controls the communication protocols and connections to the devices under test. The Flash-based ProASIC3E FPGA from Microsemi is used as a control system. This adaptive system enables the control of new payloads and softcores for test and validation in space. Thus, the integration can be easily performed through configuration parameters. It is intended for modularity. Each component connected to the test bed can have a specific interface programmed using a hardware description language (HDL). The data of each component is stored in embedded memories. Each component has its own memory space. The size of the allocated memory can be also configured. The data transfer priority can be set and packaging can be added to the logic, when needed. Communication with peripheral devices and with the Onboard Computer (OBC) is done through the pre-implemented protocols, such as I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface) and external memory control. In loco primary tests demonstrated the control system's functionality. The commercial ProASIC3E FPGA family is not space-flight qualified, but tests have been made under Total Ionizing Dose (TID) showing its robustness up to 25 kr

  14. Wein bridge oscillator circuit

    NASA Technical Reports Server (NTRS)

    Lipoma, P. C.

    1971-01-01

    Circuit with minimum number of components provides stable outputs of 2 to 8 volts at frequencies of .001 to 100 kHz. Oscillator exhibits low power consumption, portability, simplicity, and drive capability, it has application as loudspeaker tester and audible alarm, as well as in laboratory and test generators.

  15. Optimal Test Design with Rule-Based Item Generation

    ERIC Educational Resources Information Center

    Geerlings, Hanneke; van der Linden, Wim J.; Glas, Cees A. W.

    2013-01-01

    Optimal test-design methods are applied to rule-based item generation. Three different cases of automated test design are presented: (a) test assembly from a pool of pregenerated, calibrated items; (b) test generation on the fly from a pool of calibrated item families; and (c) test generation on the fly directly from calibrated features defining…

  16. Development, testing, and demonstration of an optimal fine coal cleaning circuit

    SciTech Connect

    Mishra, M.; Placha, M.; Bethell, P.

    1995-11-01

    The overall objective of this project is to improve the efficiency of fine coal cleaning. The project will be completed in two phases: bench-scale testing and demonstration of four advanced flotation cells and; in-plant proof-of-concept (POC) pilot plant testing of two flotation cells individually and in two-stage combinations. The goal is to ascertain if a two-stage circuit can result in reduced capital and operating costs while achieving improved separation efficiency. The plant selected for this project, Cyprus Emerald Coal Preparation plant, cleans 1200 tph of raw coal. The plant produces approximately 4 million tonnes of clean coal per year at an average as received energy content of 30.2 MJ/Kg (13,000 Btu/lb).

  17. Magnetic Circuit Model of PM Motor-Generator to Predict Radial Forces

    NASA Technical Reports Server (NTRS)

    McLallin, Kerry (Technical Monitor); Kascak, Peter E.; Dever, Timothy P.; Jansen, Ralph H.

    2004-01-01

    A magnetic circuit model is developed for a PM motor for flywheel applications. A sample motor is designed and modeled. Motor configuration and selection of materials is discussed, and the choice of winding configuration is described. A magnetic circuit model is described, which includes the stator back iron, rotor yoke, permanent magnets, air gaps and the stator teeth. Iterative solution of this model yields flux linkages, back EMF, torque, power, and radial force at the rotor caused by eccentricity. Calculated radial forces are then used to determine motor negative stiffness.

  18. Generation of copper rich metallic phases from waste printed circuit boards.

    PubMed

    Cayumil, R; Khanna, R; Ikram-Ul-Haq, M; Rajarao, R; Hill, A; Sahajwalla, V

    2014-10-01

    The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150°C under argon gas flowing at 1L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the metallic phase. The heat treatment temperature was chosen to be above the melting point of copper; molten copper helped to concentrate metallic constituents and their separation from the carbonaceous residue and the slag. Inert atmosphere prevented the re-oxidation of metals and the loss of carbon in the gaseous fraction. Recycling e-waste is expected to lead to enhanced metal recovery, conserving natural resources and providing an environmentally

  19. Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA

    SciTech Connect

    Cole, E.I. Jr.

    1995-09-01

    Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy CIVA (LECIVA) are three new failure analysis imaging techniques developed to quickly localize defects on ICs. All three techniques utilize the voltage fluctuations of a constant current power supply as an electron or photon beam is scanned across an IC. CIVA and LECIVA yield rapid localization of open interconnections on ICs. LIVA allows quick localization of open-circuited and damaged semiconductor junctions. LIVA can also be used to image transistor logic states and can be performed from the backside of ICs with an infrared laser source. The physics of signal generation for each technique and examples of their use in failure analysis are described.

  20. Validation Testing of Hydrogen Generation Technology

    SciTech Connect

    Smith, Barton; Toops, Todd J

    2007-12-01

    This report describes the results of testing performed by ORNL for Photech Energies, Inc. The objective of the testing was to evaluate the efficacy of Photech's hydrogen generation reactor technology, which produces gaseous hydrogen through electrolysis. Photech provided several prototypes of their proprietary reactor for testing and the ancillary equipment, such as power supplies and electrolyte solutions, required for proper operation of the reactors. ORNL measured the production of hydrogen gas (volumetric flow of hydrogen at atmospheric pressure) as a function of input power and analyzed the composition of the output stream to determine the purity of the hydrogen content. ORNL attempted measurements on two basic versions of the prototype reactors-one version had a clear plastic outer cylinder, while another version had a stainless steel outer cylinder-but was only able to complete measurements on reactors in the plastic version. The problem observed in the stainless steel reactors was that in these reactors most of the hydrogen was produced near the anodes along with oxygen and the mixed gases made it impossible to determine the amount of hydrogen produced. In the plastic reactors the production of hydrogen gas increased monotonically with input power, and the flow rates increased faster at low input powers than they did at higher input powers. The maximum flow rate from the cathode port measured during the tests was 0.85 LPM at an input power of about 1100 W, an electrolyte concentration of 20%. The composition of the flow from the cathode port was primarily hydrogen and water vapor, with some oxygen and trace amounts of carbon dioxide. An operational mode that occurs briefly during certain operating conditions, and is characterized by flashes of light and violent bubbling near the cathode, might be attributable to the combustion of hydrogen and oxygen in the electrolyte solution.

  1. Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space

    NASA Technical Reports Server (NTRS)

    Johnston, Allan H.; Rax, Bernard G.

    2006-01-01

    This paper discusses mechanisms and circuit-related factors that affect the degradation of linear integrated circuits from radiation in space. For some circuits there is sufficient degradation to affect performance at total dose levels below 4 krad(Si) because the circuit design techniques require higher gain for the pnp transistors that are the most sensitive to radiation. Qualification methods are recommended that include displacement damage as well as ionization damage.

  2. Analysis and comparison of real-time sine-wave generation for PWM circuits. [Pulse Width Modulation

    SciTech Connect

    Mirkazemi-Moud, M.; Green, T.C.; Williams, B.W. . Dept. of Computing and Electrical Engineering)

    1993-01-01

    The paper presented four methods for hardware and software generation in real time of sine waves suitable for PWM circuits. The sine waves are derived from a truncated modified cosine Taylor series, wt([pi]-wt) function, a digitally filtered trapezoid, and a second-order differential equation. Triple injection is incorporated by the addition of a defined magnitude triangular waveform of three times the fundamental frequency. Each sine wave generating technique is implemented, as applicable, in a programmable logic cell array and/or in microprocessor-based software. In each case, the output spectra and total harmonic distortion are compared with computer-simulated results.

  3. A rule-based software test data generator

    NASA Technical Reports Server (NTRS)

    Deason, William H.; Brown, David B.; Chang, Kai-Hsiung; Cross, James H., II

    1991-01-01

    Rule-based software test data generation is proposed as an alternative to either path/predicate analysis or random data generation. A prototype rule-based test data generator for Ada programs is constructed and compared to a random test data generator. Four Ada procedures are used in the comparison. Approximately 2000 rule-based test cases and 100,000 randomly generated test cases are automatically generated and executed. The success of the two methods is compared using standard coverage metrics. Simple statistical tests showing that even the primitive rule-based test data generation prototype is significantly better than random data generation are performed. This result demonstrates that rule-based test data generation is feasible and shows great promise in assisting test engineers, especially when the rule base is developed further.

  4. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 47 Telecommunication 5 2014-10-01 2014-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  5. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 47 Telecommunication 5 2013-10-01 2013-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  6. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 47 Telecommunication 5 2012-10-01 2012-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  7. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 47 Telecommunication 5 2010-10-01 2010-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  8. In-plant testing of a novel coal cleaning circuit using advanced technologies, Quarterly report, March 1 - May 31, 1996

    SciTech Connect

    Honaker, R.Q.; Reed, S.; Mohanty, M.K.

    1996-12-31

    Research conducted at Southern Illinois University at Carbondale over the past two years has identified highly efficient methods for treating fine coal (i.e., -28 mesh). In this study, a circuit comprised of the three advanced fine coal cleaning technologies is being tested in an operating preparation plant to evaluate circuit performance and to compare the performance with the current technologies used to treat -16 mesh fine coal. The circuit integrated a Floatex hydrosizer, a Falcon concentrator and a Jameson froth flotation cell. The Floatex hydrosizer is being used as a primary cleaner for the nominally -16 mesh Illinois No. 5 fine coal circuit feed. The overflow of the Floatex is screened at 48 mesh using a Sizetec vibratory screen to produce a clean coal product from the screen overflow. The screen overflow is further treated by the Falcon and Jameson Cell. During this reporting period, tests were initiated on the fine coal circuit installed at the Kerr-McGee Galatia preparation plant. The circuit was found to reduce both the ash content and the pyritic sulfur content. Additional in-plant circuitry tests are ongoing.

  9. Design and testing of an all-digital readout integrated circuit for infrared focal plane arrays

    NASA Astrophysics Data System (ADS)

    Kelly, Michael; Berger, Robert; Colonero, Curtis; Gregg, Mark; Model, Joshua; Mooney, Daniel; Ringdahl, Eric

    2005-08-01

    The digital focal plane array (DFPA) project demonstrates the enabling technologies necessary to build readout integrated circuits for very large infrared focal plane arrays (IR FPAs). Large and fast FPAs are needed for a new class of spectrally diverse sensors. Because of the requirement for high-resolution (low noise) sampling, and because of the sample rate needed for rapid acquisition of high-resolution spectra, it is highly desirable to perform analog-to-digital (A/D) conversion right at the pixel level. A dedicated A/D converter located under every pixel in a one-million-plus element array, and all-digital readout integrated circuits will enable multi- and hyper-spectral imaging systems with unprecedented spatial and spectral resolution and wide area coverage. DFPAs provide similar benefits to standard IR imaging systems as well. We have addressed the key enabling technologies for realizing the DFPA architecture in this work. Our effort concentrated on demonstrating a 60-micron footprint, 14-bit A/D converter and 2.5 Gbps, 16:1 digital multiplexer, the most basic components of the sensor. The silicon test chip was fabricated in a 0.18-micron CMOS process, and was designed to operate with HgxCd1-xTe detectors at cryogenic temperatures. Two A/D designs, one using static logic and one using dynamic logic, were built and tested for performance and power dissipation. Structures for evaluating the bit-error-rate of the multiplexer on-chip and through a differential output driver were implemented for a complete performance assessment. A unique IC probe card with fixtures to mount into an evacuated, closed-cycle helium dewar were also designed for testing up to 2.5 Gbps at temperatures as low as 50 K.

  10. Approval tests and standards for closed-circuit escape respirators. Final rule.

    PubMed

    2012-03-01

    This final rule announces updated requirements that the National Institute for Occupational Safety and Health (NIOSH or Agency), located within the Centers for Disease Control and Prevention (CDC) in the Department of Health and Human Services (HHS or Department), will employ to test and approve closed-circuit respirators used for escaping atmospheres considered to be immediately dangerous to life and health, including such respirators required by the Mine Safety and Health Administration (MSHA) for use in underground coal mines. NIOSH and MSHA jointly review and approve this type of respirator used for mine emergencies under regulations concerning approval of respiratory protective devices. NIOSH also approves these respirators for use in other work environments where escape equipment may be provided to workers, such as on vessels operated by U.S. Navy and Coast Guard personnel. The purpose of these updated requirements is to enable NIOSH and MSHA to more effectively ensure the performance, reliability, and safety of CCERs. PMID:22420059

  11. Off-line, built-in test techniques for VLSI circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G.; Sievers, M. W.

    1982-01-01

    It is shown that the use of redundant on-chip circuitry improves the testability of an entire VLSI circuit. In the study described here, five techniques applied to a two-bit ripple carry adder are compared. The techniques considered are self-oscillation, self-comparison, partition, scan path, and built-in logic block observer. It is noted that both classical stuck-at faults and nonclassical faults, such as bridging faults (shorts), stuck-on x faults where x may be 0, 1, or vary between the two, and parasitic flip-flop faults occur in IC structures. To simplify the analysis of the testing techniques, however, a stuck-at fault model is assumed.

  12. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyses required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  13. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, J. A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  14. Transmission line based short pulse generation circuits in a 0.13 μm complementary metal-oxide-semiconductor technology

    NASA Astrophysics Data System (ADS)

    Zou, Huan; Geng, Yongtao; Wang, Pingshan

    2011-02-01

    A few traditional pulse forming circuits are implemented and compared in a commercial 0.13 μm digital CMOS technology. Standard on-chip transmission lines are used as pulse forming lines (PFLs), while CMOS transistors are used as switches. The shortest output pulses of these circuits are analyzed and compared through Cadence Spectre simulations. All the CMOS circuits are fabricated in the commercial technology. Pulses of ˜170 ps durations and 120-400 mV amplitudes are obtained when the power supply is tuned from 1.2 to 2 V. The results show that these traditional PFL based circuits can be implemented in standard CMOS technology for high power short pulse generations. Furthermore, the PFL circuits significantly extend the short pulse generation capabilities of CMOS technologies.

  15. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  16. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  17. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  18. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  19. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  20. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  1. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  2. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  3. Implementation of 140 Gb/s true random bit generator based on a chaotic photonic integrated circuit.

    PubMed

    Argyris, Apostolos; Deligiannidis, Stavros; Pikasis, Evangelos; Bogris, Adonis; Syvridis, Dimitris

    2010-08-30

    In the present work a photonic integrated circuit (PIC) that emits broadband chaotic signals is employed for ultra-fast generation of true random bit sequences. Chaotic dynamics emerge from a DFB laser, accompanied by a monolithic integrated 1-cm long external cavity (EC) that provides controllable optical feedback. The short length minimizes the existence of external cavity modes, so flattened broadband spectra with minimized intrinsic periodicities can emerge. After sampling and quantization--without including optical de-correlation techniques and using most significant bits (MSB) elimination post-processing--truly random bit streams with bit-rates as high as 140 Gb/s can be generated. Finally, the extreme robustness of the random bit generator for adaptive bit-rate operation and for various operating conditions of the PIC is demonstrated. PMID:20940769

  4. Characteristics analysis of a high speed permanent magnet synchronous generator using the transfer relations theorem and equivalent circuit method

    NASA Astrophysics Data System (ADS)

    Jang, Seok-Myeong; Ko, Kyoung-Jin; Park, Ji-Hoon; Cho, Han-Wook; Hong, Jung-Pyo

    2008-04-01

    This paper presents analytical methods to predict the magnetic field distribution, electrical parameters, and output characteristics of a high speed synchronous generator equipped with surface-mounted permanent magnet. In order to analyze the magnetic field distribution and to estimate the electrical parameters, electromagnetic transfer relation (TR) theorem is employed. Moreover, output characteristics for variable resistive load and the operating speed are also obtained by solving the permanent magnet machine's equivalent circuit equation. The analytical results are validated extensively by nonlinear finite element analysis and experimental results.

  5. "MSTGen": Simulated Data Generator for Multistage Testing

    ERIC Educational Resources Information Center

    Han, Kyung T.

    2013-01-01

    Multistage testing, or MST, was developed as an alternative to computerized adaptive testing (CAT) for applications in which it is preferable to administer a test at the level of item sets (i.e., modules). As with CAT, the simulation technique in MST plays a critical role in the development and maintenance of tests. "MSTGen," a new MST…

  6. CATGEN: A Computer Assisted Test Generator.

    ERIC Educational Resources Information Center

    McCallum, L. W.

    1985-01-01

    Procedures for generating multiple-choice exams in psychology using the Apple IIe computer and the Applewriter II text editing software are described. The model is simple to use and provides flexibility in sequencing the choice of items from an instructor generated pool. (Author/RM)

  7. Effect of High-Humidity Testing on Material Parameters of Flexible Printed Circuit Board Materials

    NASA Astrophysics Data System (ADS)

    Lahokallio, Sanna; Saarinen, Kirsi; Frisk, Laura

    2013-09-01

    The tendency of polymers to absorb moisture impairs especially their electrical and mechanical properties. These are important characteristics for printed circuit board (PCB) materials, which should provide mechanical support as well as electrical insulation in many different environments in order to guarantee safe operation for electrical devices. Moreover, the effects of moisture are accelerated at increased temperatures. In this study, three flexible PCB dielectric materials, namely polyimide (PI), fluorinated ethylene-propylene (FEP), and polyethylene terephthalate (PET), were aged over different periods of time in a high-humidity test, in which the temperature was 85°C and relative humidity 85%. After aging, the changes in the structure of the polymers were studied by determining different material parameters such as modulus of elasticity, glass-transition temperature, melting point, coefficient of thermal expansion, water absorption, and crystallinity, and changes in the chemical structure with several techniques including thermomechanical analysis, differential scanning calorimetry, Fourier-transform infrared spectroscopy, moisture analysis, and a precision scale. The results showed that PI was extremely stable under the aging conditions and therefore an excellent choice for electrical applications under harsh conditions. Similarly, FEP proved to be relatively stable under the applied aging conditions. However, its crystallinity increased markedly during aging, and after 6000 h of aging the results indicated oxidation. PET suffered from hydrolysis during the test, leading to its embrittlement after 2000 h of aging.

  8. Flow Quality Studies of the NASA Glenn Research Center Icing Research Tunnel Circuit (1995 Tests)

    NASA Technical Reports Server (NTRS)

    Arrington, E. Allen; Kee-Bowling, Bonnie A.; Gonsalez, Jose C.

    2000-01-01

    The purpose of conducting the flow-field surveys described in this report was to more fully document the flow quality in several areas of the tunnel circuit in the NASA Glenn Research Center Icing Research Tunnel. The results from these surveys provide insight into areas of the tunnel that were known to exhibit poor flow quality characteristics and provide data that will be useful to the design of flow quality improvements and a new heat exchanger for the facility. An instrumented traversing mechanism was used to survey the flow field at several large cross sections of the tunnel loop over the entire speed range of the facility. Flow-field data were collected at five stations in the tunnel loop, including downstream of the fan drive motor housing, upstream and downstream of the heat exchanger, and upstream and downstream of the spraybars located in the settling chamber upstream of the test section. The data collected during these surveys greatly expanded the data base describing the flow quality in each of these areas. The new data matched closely the flow quality trends recorded from earlier tests. Data collected downstream of the heat exchanger and in the settling chamber showed how the configuration of the folded heat exchanger affected the pressure, velocity, and flow angle distributions in these areas. Smoke flow visualization was also used to qualitatively study the flow field in an area downstream of the drive fan and in the settling chamber/contraction section.

  9. Tbr2 is required to generate a neural circuit mediating the pupillary light reflex.

    PubMed

    Sweeney, Neal T; Tierney, Hannah; Feldheim, David A

    2014-04-16

    There are ∼20 types of retinal ganglion cells (RGCs) in mice, each of which has distinct molecular, morphological, and physiological characteristics. Each RGC type sends axon projections to specific brain areas that execute light-dependent behaviors. Here, we show that the T-box transcription factor Tbr2 is required for the development of several RGC types that participate in non-image-forming circuits. These types are molecularly distinct, project to non-image-forming targets, and include intrinsically photosensitive RGCs. Tbr2 mutant mice have reduced retinal projections to non-image-forming nuclei and an attenuated pupillary light reflex. These data demonstrate that Tbr2 acts to execute RGC type choice and/or survival in a set of RGCs that mediates light-induced subconscious behaviors. PMID:24741035

  10. Liquid crystal waveguide technologies for a new generation of low-power photonic integrated circuits

    NASA Astrophysics Data System (ADS)

    d'Alessandro, Antonio; Martini, Luca; Civita, Luca; Beccherelli, Romeo; Asquini, Rita

    2015-03-01

    In this paper we show two approaches to fabricate photonic channels on different substrate technology platforms, in particular silicon and polydimethylsiloxane (PDMS), for flexible photonic integrated circuits. The electro-optic effect and nonlinear optical properties of liquid crystals (LC) allow the realization of low cost and low energy consumption optoelectronic devices operating at both visible and near-infrared wavelengths. High extinction ratio and large tuning range guided wave devices will be presented to be used for both optofluidic and datacom applications, in which both low realization costs and low power consumption are key features. In particular we will show our recent results on polarization independent light propagation in waveguides whose core consists of LC infiltrated in PDMS channels (LC:PDMS waveguides) fully compatible with optofluidic and lab-on-chip microsystems.

  11. Status of the integrated topping cycle and MHD generator testing

    SciTech Connect

    Pian, C.C.P.; Dunton, A.W.; Schmitt, E.W.; Morrison, D.J.

    1993-12-31

    The status of the Integrated Topping Cycle (ITC) MHD generator testing is presented. This generator is part of a 50 MW{sub t} prototypic powertrain that is currently undergoing proof-of-concept (POC) testing at the U.S. Department of Energy`s Component Development and Integration Facility in Butte, Montana. Test objectives are to establish component lifetimes at prototypic operating conditions and to verify the design performance parameters. The ITC generator has completed Design Verification Testing and is now well into the POC duration test. To date (May 1, 1993), over 360 hours of the planned 1000 hours of testing has been completed. Generator testing is being performed at conditions representative of commercial power plant operating conditions. Prototypic generator channel hardware is performing very well. Based on test results obtained thus far, the prognosis is excellent for meeting all of the POC test objectives.

  12. Characterization of devices, circuits, and high-temperature superconductor transmission lines by electro-optic testing

    NASA Technical Reports Server (NTRS)

    Whitaker, John F.

    1991-01-01

    The development of a capability for testing transmission lines, devices, and circuits using the optically-based technique of electro-optics sampling was the goal of this project. Electro-optic network analysis of a high-speed device was demonstrated. The project involved research on all of the facets necessary in order to realize this result, including the discovery of the optimum electronic pulse source, development of an adequate test fixture, improvement of the electro-optic probe tip, and identification of a device which responded at high frequency but did not oscillate in the test fixture. In addition, during the process of investigating patterned high-critical-temperature superconductors, several non-contacting techniques for the determination of the transport properties of high T(sub c) films were developed and implemented. These are a transient, optical pump-probe, time-resolved reflectivity experiment, an impulsive-stimulated Raman scattering experiment, and a terahertz-beam coherent-spectroscopy experiment. The latter technique has enabled us to measure both the complex refractive index of an MgO substrate used for high-T(sub c) films and the complex conductivity of a YBa2Cu3O(7-x) sample. This information was acquired across an extremely wide frequency range: from the microwave to the submillimeter-wave regime. The experiments on the YBCO were conducted without patterning of, or contact to, the thin film. Thus, the need for the more difficult transmission-line experiments was eliminated. Progress in all of these areas was made and is documented in a number of papers. These papers may be found in the section listing the abstracts of the publications that were issued during the course of the research.

  13. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such'as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAxwell's equations by the Finite Integration Algorithm (MAFIA) is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  14. Adding Test Generation to the Teaching Machine

    ERIC Educational Resources Information Center

    Bruce-Lockhart, Michael; Norvell, Theodore; Crescenzi, Pierluigi

    2009-01-01

    We propose an extension of the Teaching Machine project, called Quiz Generator, that allows instructors to produce assessment quizzes in the field of algorithm and data structures quite easily. This extension makes use of visualization techniques and is based on new features of the Teaching Machine that allow third-party visualizers to be added as…

  15. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 19 2011-07-01 2011-07-01 false Transient test cycle generation. 86...) Emission Regulations for New Otto-Cycle and Diesel Heavy-Duty Engines; Gaseous and Particulate Exhaust Test Procedures § 86.1333-90 Transient test cycle generation. (a) The heavy-duty transient engine cycles for...

  16. Test-Aerosol Generator For Calibrating Particle Counters

    NASA Technical Reports Server (NTRS)

    Mogan, Paul A.; Adams, Alois J.; Schwindt, Christian J.; Hodge, Timothy R.; Mallow, Tim J.; Duong, Anh A.; Bukauskas, Vyto V.

    1996-01-01

    Apparatus generates clean, stable aerosol stream for use in testing and calibrating laser-based aerosol-particle counter. Size and concentration of aerosol particles controlled to ensure accurate calibration. Cheap, widely available medical nebulizers used to generate aerosols.

  17. Approximate circuits for increased reliability

    SciTech Connect

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-08-18

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  18. Approximate circuits for increased reliability

    SciTech Connect

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-12-22

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  19. 4-bit Bipolar Triangle Voltage Waveform Generator Using Single-Flux-Quantum Circuit

    NASA Astrophysics Data System (ADS)

    Watanabe, Tomoki; Takahashi, Yoshitaka; Shimada, Hiroshi; Maezawa, Masaaki; Mizugaki, Yoshinao

    SFQ digital-to-analog converters (DACs) are one of the candidates for AC voltage standards. We have proposed SFQ-DACs based on frequency modulation (FM). Bipolar output is required for applications of AC voltage standards, while our previous SFQ-DACs generated only positive voltages. In this paper, we present our design of a 4-bit bipolar triangle voltage waveform generator comprising an SFQ-DAC. The waveform generator has two output ports. Synthesized half-period waveforms are alternately generated in one of the output ports. The bipolar output is realized by observing the differential voltage between the ports. We confirmed a 72-μVPP bipolar triangle voltage waveform at the frequency of 35.7 Hz.

  20. Penetration tests in next generation networks

    NASA Astrophysics Data System (ADS)

    Rezac, Filip; Voznak, Miroslav

    2012-06-01

    SIP proxy server is without any doubts centerpiece of any SIP IP telephony infrastructure. It also often provides other services than those related to VoIP traffic. These softswitches are, however, very often become victims of attacks and threats coming from public networks. The paper deals with a system that we developed as an analysis and testing tool to verify if the target SIP server is adequately secured and protected against any real threats. The system is designed as an open-source application, thus allowing independent access and is fully extensible to other test modules.

  1. Generation of multi-qubit entanglement in a superconducting quantum circuit by parallelized parity measurements

    NASA Astrophysics Data System (ADS)

    Poletto, Stefano; Riste', Diego; Huang, Meng-Zi; Bruno, Alessandro; Vesterinen, Visa; Saira, Olli-Pentti; Dicarlo, Leonardo

    2015-03-01

    We present the generation of multi-qubit entanglement using parallelized ancilla-based parity measurements in a five qubit superconducting processor. Two-qubit Bell states and three-qubit GHZ-type states are generated by single and double two-qubit parity measurements on superposition states, respectively, and characterized by both witnessing and state tomography. The protocol for generation of GHZ-type states can be used as the encoding step in the three-qubit bit-flip quantum error correction code, and made deterministic by digital feedback control. We assess its performance by state tomography of the six encoded cardinal states, and compare to the traditional method of encoding by gates. We acknowledge funding from NWO, FOM and EU FP7 project Scale QIT.

  2. Short circuiting the circadian system with a new generation of precision tools.

    PubMed

    Loh, Dawn H; Kudo, Takashi; Colwell, Christopher S

    2015-03-01

    Circadian behavior in mammals is coordinated by neurons within the suprachiasmatic nucleus (SCN). In this issue, Lee et al. (2015) and Mieda et al. (2015) applied state-of-the-art genetic tools to dissect the microcircuits within the SCN generating circadian rhythmic behavior. PMID:25741718

  3. The short-circuit test results of 6.9 kV/2.3 kV 400 kVA-class YBCO model transformer

    NASA Astrophysics Data System (ADS)

    Tomioka, A.; Otonari, T.; Ogata, T.; Iwakuma, M.; Okamoto, H.; Hayashi, H.; Iijima, Y.; Saito, T.; Gosho, Y.; Tanabe, K.; Izumi, T.; Shiohara, Y.

    2011-11-01

    We are developing an elemental technology for 66 kV/6.9 kV 20 MVA-class power transformer with YBCO conductors. The protection of short-circuit technology is one of the elemental technologies for HTS transformer. Since short-circuit current is much higher than critical current of YBCO tape, there is a possibility that superconducting characteristics may be damaged during short-circuit period. We made a conductor to compose the YBCO tape with copper tape. We manufactured 6.9 kV/2.3 kV 400 kVA-class YBCO model transformer using this conductor and performed short-circuit current test. The short-circuit current of primary winding was 346 A which was about six times larger than the rated current. The I-V characteristics of the winding did not change before and after the test. We may consider this conductor withstands short-circuit current.

  4. 40 CFR 86.1333 - Transient test cycle generation.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    .... The generation of the maximum torque curve is described in 40 CFR part 1065. (b) Example of the...: ER28AP14.006 Where: Max Test Speed = the maximum test speed as calculated in 40 CFR part 1065. (ii) For Otto-cycle engines: ER28AP14.007 Where: Max Test Speed = the maximum test speed as calculated in 40...

  5. Model Based Analysis and Test Generation for Flight Software

    NASA Technical Reports Server (NTRS)

    Pasareanu, Corina S.; Schumann, Johann M.; Mehlitz, Peter C.; Lowry, Mike R.; Karsai, Gabor; Nine, Harmon; Neema, Sandeep

    2009-01-01

    We describe a framework for model-based analysis and test case generation in the context of a heterogeneous model-based development paradigm that uses and combines Math- Works and UML 2.0 models and the associated code generation tools. This paradigm poses novel challenges to analysis and test case generation that, to the best of our knowledge, have not been addressed before. The framework is based on a common intermediate representation for different modeling formalisms and leverages and extends model checking and symbolic execution tools for model analysis and test case generation, respectively. We discuss the application of our framework to software models for a NASA flight mission.

  6. Testing to Characterize the Advanced Stirling Radioisotope Generator Engineering Unit

    NASA Technical Reports Server (NTRS)

    Lewandowski, Edward; Schreiber, Jeffrey

    2010-01-01

    The Advanced Stirling Radioisotope Generator (ASRG), a high efficiency generator, is being considered for space missions. Lockheed Martin designed and fabricated an engineering unit (EU), the ASRG EU, under contract to the Department of Energy. This unit is currently undergoing extended operation testing at the NASA Glenn Research Center to generate performance data and validate life and reliability predictions for the generator and the Stirling convertors. It has also undergone performance tests to characterize generator operation while varying control parameters and system inputs. This paper summarizes and explains test results in the context of designing operating strategies for the generator during a space mission and notes expected differences between the EU performance and future generators.

  7. A PC-based generator of surface ECG potentials for computer electrocardiograph testing.

    PubMed

    Franchi, D; Palagi, G; Bedini, R

    1994-02-01

    The system is composed of an electronic circuit, connected to a PC, whose outputs, starting from ECGs digitally collected by commercial interpretative electrocardiographs, simulate virtual patients' limb and chest electrode potentials. Appropriate software manages the D/A conversion and lines up the original short-term signal in a ring buffer to generate continuous ECG traces. The device also permits the addition of artifacts and/or baseline wanders/shifts on each lead separately. The system has been accurately tested and statistical indexes have been computed to quantify the reproduction accuracy analyzing, in the generated signal, both the errors induced on the fiducial point measurements and the capability to retain the diagnostic significance. The device integrated with an annotated ECG data base constitutes a reliable and powerful system to be used in the quality assurance testing of computer electrocardiographs. PMID:8004944

  8. Model-Driven Test Generation of Distributed Systems

    NASA Technical Reports Server (NTRS)

    Easwaran, Arvind; Hall, Brendan; Schweiker, Kevin

    2012-01-01

    This report describes a novel test generation technique for distributed systems. Utilizing formal models and formal verification tools, spe cifically the Symbolic Analysis Laboratory (SAL) tool-suite from SRI, we present techniques to generate concurrent test vectors for distrib uted systems. These are initially explored within an informal test validation context and later extended to achieve full MC/DC coverage of the TTEthernet protocol operating within a system-centric context.

  9. Results of the integrated topping cycle MHD generator testing

    SciTech Connect

    Pian, C.C.P.; Schmitt, E.W.

    1994-12-31

    The results of the Integrated Topping Cycle (ITC) MHD generator tests are presented. This generator is part of a 50 MW{sub t} prototypic powertrain which recently completed proof-of-concept (POC) testing at the U.S. Department of Energy`s Component Development and Integration Facility (CDIF) in Butte, Montana. POC duration testing was carried out at conditions representative of commercial power plant operation, in order to establish component lifetimes and to verify the design performance parameters. Over 500 hours of thermal and power testing was cumulated with the generator hardware before the program funding was terminated. A summary of the MHD generator performance characteristics and hardware evaluations is provided in the paper. A summary of the generator performance throughout the POC test series is presented. Included are comparisons of: (1) plasma electrical conductivities measured early in the Design Verification Test series and during the POC series, (2) measured generator performance with analytical predictions, and (3) internal wall leakage characteristics of the generator channel with and without iron oxide addition. The performance requirement of the ITC program, i.e., the demonstration of 1.5 MW{sub e} power output, was easily achieved. The ITC generator channel, nozzle, and diffuser accumulated more than 300 hours at nominal power conditions. The prototypic hardware performed well throughout the POC test series. Some problems did arise during the tests. but they were not life-threatening to the MHD generator. Corrective measures were implemented; they will be discussed in the full paper. The physical condition of the overall generator channel at the end of POC tests is good.

  10. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  11. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 5 2011-07-01 2011-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  12. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  13. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  14. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 40 Protection of Environment 5 2010-07-01 2010-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  15. Tests and evaluation of multihundred watt thermoelectric generators at JPL

    NASA Technical Reports Server (NTRS)

    Rouklove, P.

    1977-01-01

    The multihundred watt (MHW) thermoelectric generator, based on silicon-germanium thermoelectric technology, delivers a nominal power output of 150 watts with an efficiency of about 6%. The two Voyager space probes each use three such generators assembled in tandem on a boom. A total of seven MHW type thermoelectric generators were tested at JPL in support of the Voyager project. The tests consisted of: (1) parametric evaluation of the electrical characteristics of the devices over a wide range of output voltage for different values of input power, different operating ambients (air, vacuum), and different internal environments (argon, helium, xenon, mixture of these gases, and vacuum) at different pressures to allow evaluation of the influences of both gas and pressure on the performance of the generator; (2) tests to determine the transient behavior of the generators; and (3) operation of the generator in conjunction with the Voyager spacecraft.

  16. Testing of a direct drive generator for wind turbines

    SciTech Connect

    Sondergaard, L.M.

    1996-12-31

    The normal drive train of a wind turbine consists a gearbox and a 4 to 8 poles asynchronous generator. The gearbox is an expensive and unreliable components and this paper deals with testing of a direct drive synchronous generator for a gearless wind turbine. The Danish company Belt Electric has constructed and manufactured a 27 kW prototype radial flux PM-generator (DD600). They have used cheap hard ferrite magnets in the rotor of this PM-generator. This generator has been tested at Riso and the test results are investigated and analyzed in this paper. The tests have been done with three different load types (1: resistance; 2: diode rectifier, DC-capacitor, resistance; 3: AC-capacitor, diode rectifier, DC-capacitor, resistance). 1 ref., 9 figs., 5 tabs.

  17. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, David M.

    1996-01-01

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit.

  18. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, D.M.

    1996-11-05

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit. 5 figs.

  19. Gas Generation Testing of Neptunium Oxide at Elevated Temperature

    SciTech Connect

    Duffey, JM

    2004-01-30

    Elevated temperature gas generation tests have been conducted using neptunium dioxide produced on a laboratory scale using the HB-Line Phase II flowsheet. These tests were performed to determine what effect elevated temperatures would have on the neptunium dioxide in comparison to neptunium dioxide tested at ambient temperature. The headspace gas compositions following storage at elevated temperatures associated with normal conditions of transport (NCT) have been measured. These test results show an increase in hydrogen generation rate at elevated temperature and significant removal of oxygen from the headspace gas. The elevated temperature gas generation tests described in this report involved heating small test vessels containing neptunium dioxide and measuring the headspace gas pressure and composition at the end of the test period. Four samples were used in these tests to evaluate the impact of process variables on the gas generation rate. Two samples were calcined to 600 degrees Celsius and two were calcined to 650 degrees Celsius. Each test vessel contained approximately 9.5 g of neptunium dioxide. Following exposure to 75 per cent relative humidity (RH) for five days, these samples were loaded in air and then heated to between 105 and 115 degrees Celsius for about one month. At the conclusion of the test period, the headspace gas of each container was analyzed using a micro-gas chromatograph installed in the glovebox where the experiments were conducted. The pressure, volume, and composition data for the headspace gas samples were used to calculate average H2 generation rates.

  20. Statistical Tests of the Apple IIe Random Number Generator Yield Suggestions from Generator Seeding.

    ERIC Educational Resources Information Center

    Gleason, John M.

    1988-01-01

    Discusses flaws in the Apple IIe Applesoft random number generator, RND, and reports results of frequency and serial correlation tests of the generator. Suggestions of seeds that yield sequences of numbers which pass fundamental screening tests for randomness are presented. (Author/LRW)

  1. Ion beam induced charge collection (IBICC) from integrated circuit test structures using a 10 MeV carbon microbeam

    SciTech Connect

    Guo, B. N.; El Bouanani, M.; Duggan, J. L.; McDaniel, F. D.; Renfrow, S. N.; Doyle, B. L.; Walsh, D. S.; Aton, T. J.

    1999-06-10

    As feature sizes of Integrated Circuits (ICs) continue to shrink, the sensitivity of these devices, particularly SRAMs and DRAMs, to natural radiation is increasing. In this paper, the Ion Beam Induced Charge Collection (IBICC) technique is utilized to simulate neutron-induced Si recoil effects in ICs. The IBICC measurements, conducted at the Sandia National Laboratories, employed a 10 MeV carbon microbeam with 1{mu}m diameter spot to scan test structures on specifically designed ICs. With the aid of IC layout information, an analysis of the charge collection efficiency from different test areas is presented.

  2. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players

    PubMed Central

    Papoti, M; Da Silva, ASR; Barbieri, RA; Campos, EZ; Ferreira, EC; Loures, JP; Chamari, K

    2016-01-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1, lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L-1: 9.5±1.2 and 8.1±1.0 km∙h-1; 3.5 mmol∙L-1: 12.0±1.2 and 10.2±1.1 km∙h-1; Dmax: 11.4±1.4 and 9.3±0.4 km∙h-1; peak lactate: 14.9±1.6 and 10.9±0.8 km∙h-1). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1 and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players. PMID:27601781

  3. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players.

    PubMed

    Zagatto, A M; Papoti, M; Da Silva, Asr; Barbieri, R A; Campos, E Z; Ferreira, E C; Loures, J P; Chamari, K

    2016-09-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1), lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L(-1): 9.5±1.2 and 8.1±1.0 km∙h(-1); 3.5 mmol∙L(-1): 12.0±1.2 and 10.2±1.1 km∙h(-1); Dmax: 11.4±1.4 and 9.3±0.4 km∙h(-1); peak lactate: 14.9±1.6 and 10.9±0.8 km∙h(-1)). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1) and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players. PMID:27601781

  4. Test Input Generation for Red-Black Trees using Abstraction

    NASA Technical Reports Server (NTRS)

    Visser, Willem; Pasareanu, Corina S.; Pelanek, Radek

    2005-01-01

    We consider the problem of test input generation for code that manipulates complex data structures. Test inputs are sequences of method calls from the data structure interface. We describe test input generation techniques that rely on state matching to avoid generation of redundant tests. Exhaustive techniques use explicit state model checking to explore all the possible test sequences up to predefined input sizes. Lossy techniques rely on abstraction mappings to compute and store abstract versions of the concrete states; they explore under-approximations of all the possible test sequences. We have implemented the techniques on top of the Java PathFinder model checker and we evaluate them using a Java implementation of red-black trees.

  5. Agarose microwell based neuronal micro-circuit arrays on microelectrode arrays for high throughput drug testing.

    PubMed

    Kang, Gyumin; Lee, Ji-Hye; Lee, Chang-Soo; Nam, Yoonkey

    2009-11-21

    For cell-based biosensor applications, dissociated neurons have been cultured on planar microelectrode arrays (MEAs) to measure the network activity with substrate-embedded microelectrodes. There has been a need for a multi-well type platform to reduce the data collection time and increase the statistical power for data analysis. This study presents a novel method to convert a conventional MEA into a multi-well MEA with an array of micrometre-sized neuronal culture ('neuronal micro-circuit array'). An MEA was coated first with cell-adhesive layer (poly-D-lysine) which was subsequently patterned with a cell-repulsive layer (agarose hydrogel) to both pattern the cell adhesive region and isolate neuronal micro-circuits from each other. For a few weeks, primary hippocampal neurons were cultured on the agarose microwell MEA and the development of spontaneous electrical activities were characterized with extracellular action potentials. Using neurotransmission modulators, the simultaneous monitoring of drug responses from neuronal micro-circuit arrays was also demonstrated. The proposed approach will be powerful for neurobiological functional assay studies or neuron-based biosensor fields which require repeated trials to obtain a single data point due to biological variations. PMID:19865730

  6. MINET validation study using steam generator test data

    SciTech Connect

    Van Tuyle, G.J.; Guppy, J.G.

    1984-01-01

    Three steam generator transient test cases that were simulated using the MINET computer code are described, with computed results compared against experimental data. The MINET calculations closely agreed with the experiment for both the once-through and the U-tube steam generator test cases. The effort is part of an ongoing effort to validate the MINET computer code for thermal-hydraulic plant systems transient analysis, and strongly supports the validity of the MINET models.

  7. Modeling a Printed Circuit Heat Exchanger with RELAP5-3D for the Next Generation Nuclear Plant

    SciTech Connect

    Not Available

    2010-12-01

    The main purpose of this report is to design a printed circuit heat exchanger (PCHE) for the Next Generation Nuclear Plant and carry out Loss of Coolant Accident (LOCA) simulation using RELAP5-3D. Helium was chosen as the coolant in the primary and secondary sides of the heat exchanger. The design of PCHE is critical for the LOCA simulations. For purposes of simplicity, a straight channel configuration was assumed. A parallel intermediate heat exchanger configuration was assumed for the RELAP5 model design. The RELAP5 modeling also required the semicircular channels in the heat exchanger to be mapped to rectangular channels. The initial RELAP5 run outputs steady state conditions which were then compared to the heat exchanger performance theory to ensure accurate design is being simulated. An exponential loss of pressure transient was simulated. This LOCA describes a loss of coolant pressure in the primary side over a 20 second time period. The results for the simulation indicate that heat is initially transferred from the primary loop to the secondary loop, but after the loss of pressure occurs, heat transfers from the secondary loop to the primary loop.

  8. CFFF testing of ceramic elements for MHD generators

    SciTech Connect

    Lineberry, J.T.; Christiansen, P.J.

    1994-12-31

    In September 1992, the POC test LMF5-J was concluded at the CFFF in accordance with the objectives as set for the western coal POC test program. During this activity, a {open_quotes}piggyback{close_quotes} type test was conducted for the Busek Company in partial fulfillment of a DOE Phase II SBIR. A near prototypical design, generator module that was designed and constructed by the Busek Co. was installed in the LMF upstream test train of the CFFF for this test. The module incorporated AlN{sub 2} (ceramic) sidebar elements. The objective of the SBIR Phase II was to evaluate the integrity of this material subject to long duration operation under typical coal-fired MHD generator conditions. A summary of the LMF5-J test at the CFFF and activities and test results relevant to the SBIR Phase II related to the Busek SBIR project are provided.

  9. The generation effect: a test between single- and multifactor theories.

    PubMed

    Burns, D J

    1990-11-01

    Single- and multifactor accounts of the generation effect (better memory for internally generated items than for externally presented items) were tested. Single-factor theories suggest that generation induces either stimulus-response relational processing or response-oriented processing. Multifactor theories suggest that generation induces both types of processing. In the first three experiments subjects either read or generated responses, and the degree of categorical structure within the list was manipulated. When categorical structure was minimal, large generation effects were observed for free recall and recognition, but not for cued recall. When categorical structure was high, however, a generation effect was observed for cued recall but not for recognition or free recall. A fourth experiment was performed to eliminate an uninteresting interpretation of the results. It is argued that a multifactor account is needed to explain these findings. PMID:2148579

  10. Performance testing of thermoelectric generators at JPL. [for space applications

    NASA Technical Reports Server (NTRS)

    Rouklove, P.; Truscello, V. C.

    1975-01-01

    Several thermoelectric generators, ranging in output power from 170 watts to microwatts, are undergoing testing at JPL. They represent a wide range of technologies using advanced PbTe, SiGe and cascaded PbTe and BiTe thermoelectric materials. Several of these generators are of an advanced concept while others are representative of the Nimbus, Transit, Viking and the multi-hundred-watt (MHW) technology. Of interest is the behavior of generators which have been tested for times in excess of 60,000 hours.

  11. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... CFR part 1065. (2) Torque is normalized to the maximum torque at the rpm listed with it. Therefore, to.... The generation of the maximum torque curve is described in 40 CFR part 1065. (b) Example of the... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  12. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... CFR part 1065. (2) Torque is normalized to the maximum torque at the rpm listed with it. Therefore, to.... The generation of the maximum torque curve is described in 40 CFR part 1065. (b) Example of the... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  13. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... CFR part 1065. (2) Torque is normalized to the maximum torque at the rpm listed with it. Therefore, to.... The generation of the maximum torque curve is described in 40 CFR part 1065. (b) Example of the... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  14. Long term tests of a SNAP-19 thermoelectric generator.

    NASA Technical Reports Server (NTRS)

    Rouklove, P.; Truscello, V.

    1972-01-01

    Results of tests performed on a SNAP 19 thermoelectric generator, SN-20. The SN-20 generator was tested for approximately 37,000 hours using electrical heating to simulate the heat released by isotope decay. After 27,000 hours of operation the output power from the generator decreased to approximately 1/3 of the beginning of life value while the internal resistance increased by a factor of 5. Analysis of the test results, confirmed by preliminary metallographic examination, indicated that the output power degradation was the result of excessive sublimation of the thermoelectric material and loss of the hot junction bond due to the depletion of the internal cover gas. This also resulted in excessive junction temperatures. Comparison is made with the behavior observed from the two flight generators and a tentative conclusion is advanced as to the reason for their failure.

  15. Molten-Caustic-Leaching (Gravimelt) System Integration Project, Phase 2. Topical report for test circuit maintenance, refurbishment, modification, and off-line operation

    SciTech Connect

    Not Available

    1993-03-01

    This is a report of the maintenance, refurbishment, modifications, and off-line circuit component testing of the integrated test circuit of the Molten-Caustic-Leaching (MCL or Gravimelt) process for the desulfurization and demineralization of coal. The project is sponsored by the Pittsburgh Energy Technology Center of the US Department of Energy under Contract No. DE-AC22-86-PC91257.

  16. Performance results of a digital test signal generator

    NASA Technical Reports Server (NTRS)

    Gutierrez-Luaces, B. O.; Marina, M.; Parham, B.

    1993-01-01

    Performance results of a digital test signal-generator hardware-demonstration unit are reported. Capabilities available include baseband and intermediate frequency (IF) spectrum generation, for which test results are provided. Repeatability in the setting of a given signal-to-noise ratio (SNR) when a baseband or an IF spectrum is being generated ranges from 0.01 dB at high SNR's or high data rates to 0.3 dB at low data rates or low SNR's. Baseband symbol SNR and carrier SNR (Pc/No) accuracies of 0.1 dB were verified with the built-in statistics circuitry. At low SNR's that accuracy remains to be fully verified. These results were confirmed with measurements from a demodulator synchronizer assembly for the baseband spectrum generation, and with a digital receiver (Pioneer 10 receiver) for the IF spectrum generation.

  17. Development and Test of a Prototype 100MVA Superconducting Generator

    SciTech Connect

    Fogarty, James M.; Bray, James W.

    2007-05-25

    In 2002, General Electric and the US Department of Energy (DOE) entered into a cooperative agreement for the development of a commercialized 100 MVA generator using high temperature superconductors (HTS) in the field winding. The intent of the program was to: • Identify and develop technologies that would be needed for such a generator. • Develop conceptual designs for generators with ratings of 100 MVA and higher using HTS technology. • Perform proof of concept tests at the 1.5 MW level for GE’s proprietary warm iron rotor HTS generator concept. • Design, build, and test a prototype of a commercially viable 100 MVA generator that could be placed on the power grid. This report summarizes work performed during the program and is provided as one of the final program deliverables.

  18. Results of closed cycle MHD power generation test with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross sectional dimensions of the MHD channel in the NASA Lewis closed loop facility were reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 160,000 n/M2, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/M. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/M were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/M3 were obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those previously reported for the M = 0.2 channel.

  19. Results of closed cycle MHD power generation tests with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross-sectional dimensions of the MHD channel in the NASA Lewis closed loop facility have been reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 1.6 x 10 to the 5th N/sq m, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/m. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/m were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/cu m have been obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those reported for the m = 0.2 channel at the last EAM Symposium.

  20. A Test Generation Framework for Distributed Fault-Tolerant Algorithms

    NASA Technical Reports Server (NTRS)

    Goodloe, Alwyn; Bushnell, David; Miner, Paul; Pasareanu, Corina S.

    2009-01-01

    Heavyweight formal methods such as theorem proving have been successfully applied to the analysis of safety critical fault-tolerant systems. Typically, the models and proofs performed during such analysis do not inform the testing process of actual implementations. We propose a framework for generating test vectors from specifications written in the Prototype Verification System (PVS). The methodology uses a translator to produce a Java prototype from a PVS specification. Symbolic (Java) PathFinder is then employed to generate a collection of test cases. A small example is employed to illustrate how the framework can be used in practice.

  1. Rational design of modular circuits for gene transcription: A test of the bottom-up approach

    PubMed Central

    2010-01-01

    Background Most of synthetic circuits developed so far have been designed by an ad hoc approach, using a small number of components (i.e. LacI, TetR) and a trial and error strategy. We are at the point where an increasing number of modular, inter-changeable and well-characterized components is needed to expand the construction of synthetic devices and to allow a rational approach to the design. Results We used interchangeable modular biological parts to create a set of novel synthetic devices for controlling gene transcription, and we developed a mathematical model of the modular circuits. Model parameters were identified by experimental measurements from a subset of modular combinations. The model revealed an unexpected feature of the lactose repressor system, i.e. a residual binding affinity for the operator site by induced lactose repressor molecules. Once this residual affinity was taken into account, the model properly reproduced the experimental data from the training set. The parameters identified in the training set allowed the prediction of the behavior of networks not included in the identification procedure. Conclusions This study provides new quantitative evidences that the use of independent and well-characterized biological parts and mathematical modeling, what is called a bottom-up approach to the construction of gene networks, can allow the design of new and different devices re-using the same modular parts. PMID:21070658

  2. Dynamic test input generation for multiple-fault isolation

    NASA Technical Reports Server (NTRS)

    Schaefer, Phil

    1990-01-01

    Recent work is Causal Reasoning has provided practical techniques for multiple fault diagnosis. These techniques provide a hypothesis/measurement diagnosis cycle. Using probabilistic methods, they choose the best measurements to make, then update fault hypotheses in response. For many applications such as computers and spacecraft, few measurement points may be accessible, or values may change quickly as the system under diagnosis operates. In these cases, a hypothesis/measurement cycle is insufficient. A technique is presented for a hypothesis/test-input/measurement diagnosis cycle. In contrast to generating tests a priori for determining device functionality, it dynamically generates tests in response to current knowledge about fault probabilities. It is shown how the mathematics previously used for measurement specification can be applied to the test input generation process. An example from an efficient implementation called Multi-Purpose Causal (MPC) is presented.

  3. A 4 V, ns-range pulse generator for the test of Cherenkov Telescopes readout electronics

    NASA Astrophysics Data System (ADS)

    Antoranz, P.; Vegas, I.; Miranda, J. M.

    2010-08-01

    We present in this paper the design, fabrication and verification of a ns-range pulse generator based on a Step Recovery Diode (SRD). This device needs only a 5 V DC power supply, delivers 1 ns pulses with peak amplitudes in excess of 4 V and features state of the art jitter figures. In addition, the pulser contains a trigger channel. The long standing problem of the SRD simulation via circuital analysis is addressed. It is shown that the dynamic properties of the Step Recovery Diode can accurately be reproduced via a small signal circuital simulation for the rise times needed in a ns-range pulser. It is also demonstrated that strong inaccuracies in the pulse shape prediction are obtained if the wave propagation through the lines typically used in this type of circuits is simulated by a simple Transverse Electromagnetic Mode (TEM) line model. Instead, it is necessary to account for non-TEM effects. By means of broadband resistive power splitters and high dynamic range amplifiers, a prototype of 4 channels was also fabricated. This prototype is particularly useful for testing the readout electronics of Cherenkov Telescopes, but additional applications to other large-scale experiments are expected, any of those where calibration or verification with compact ns-range pulsers featuring low jitter, large dynamic ranges and multichannel operation is needed. In addition, the fabrication cost of this pulser is almost negligible as compared with bulky, commercially available waveform generators, which rarely deliver ns pulses in excess of 3 V. Furthermore, the small size of the pulser presented here and its low power consumption allow an easy integration into more complex systems.

  4. Techniques for control of long-term reliability of complex integrated circuits. I - Reliability assurance by test vehicle qualification.

    NASA Technical Reports Server (NTRS)

    Van Vonno, N. W.

    1972-01-01

    Development of an alternate approach to the conventional methods of reliability assurance for large-scale integrated circuits. The product treated is a large-scale T squared L array designed for space applications. The concept used is that of qualification of product by evaluation of the basic processing used in fabricating the product, providing an insight into its potential reliability. Test vehicles are described which enable evaluation of device characteristics, surface condition, and various parameters of the two-level metallization system used. Evaluation of these test vehicles is performed on a lot qualification basis, with the lot consisting of one wafer. Assembled test vehicles are evaluated by high temperature stress at 300 C for short time durations. Stressing at these temperatures provides a rapid method of evaluation and permits a go/no go decision to be made on the wafer lot in a timely fashion.

  5. In-plant testing of a novel coal cleaning circuit using advanced technologies. Technical report, September 1--November 30, 1995

    SciTech Connect

    Honaker, R.Q.; Reed, S.

    1995-12-31

    A circuit utilizing hindered-bed classifiers, enhanced gravity concentrators and column flotation has been found to provide a highly efficient cleaning of fine coal in which both ash and total sulfur contents are significantly reduced while maximizing the recovery of coal. In this study, a circuit comprised of the three technologies will be tested in an operating preparation plant to evaluate circuit performance and to compare the performance with the current technologies used to treat fine coal. Prior to the in-plant testing, the effect of changing feed characteristics on the performance of the enhanced gravity concentrator was evaluated for process control purposes. During this reporting period, a {minus}16 mesh Illinois No. 6 coal sample containing about 30% ash and 8.0% total sulfur was collected from a refuse pond. The ash and total sulfur contents of the sample were depleted by withdrawing a controlled amount of tailings produced by the unit to determine the effect of changing feed compositions. It was found that higher combustible recovery values are achieved when the feed ash content is decreased and slightly lower product sulfur content values are obtained when the pyritic sulfur content in the feed is decreased. The lower total sulfur contents are most likely due to the natural by-pass to the product stream of 5--10% of the heavy particles. In other words, an increase in the feed sulfur content results in an incremental increase in the sulfur content of the product. The higher combustible recovery values obtained with decreasing feed ash contents are likely due to a reduction in the amount of entrapped coal particles within the bed of heavy-particles formed contiguous to the bowl wall in the Falcon unit. Higher bowl speeds and adjustment of the tailings rate have been found to counter the negative effects caused by the increase in feed ash and total sulfur contents.

  6. Automated Generation and Assessment of Autonomous Systems Test Cases

    NASA Technical Reports Server (NTRS)

    Barltrop, Kevin J.; Friberg, Kenneth H.; Horvath, Gregory A.

    2008-01-01

    This slide presentation reviews some of the issues concerning verification and validation testing of autonomous spacecraft routinely culminates in the exploration of anomalous or faulted mission-like scenarios using the work involved during the Dawn mission's tests as examples. Prioritizing which scenarios to develop usually comes down to focusing on the most vulnerable areas and ensuring the best return on investment of test time. Rules-of-thumb strategies often come into play, such as injecting applicable anomalies prior to, during, and after system state changes; or, creating cases that ensure good safety-net algorithm coverage. Although experience and judgment in test selection can lead to high levels of confidence about the majority of a system's autonomy, it's likely that important test cases are overlooked. One method to fill in potential test coverage gaps is to automatically generate and execute test cases using algorithms that ensure desirable properties about the coverage. For example, generate cases for all possible fault monitors, and across all state change boundaries. Of course, the scope of coverage is determined by the test environment capabilities, where a faster-than-real-time, high-fidelity, software-only simulation would allow the broadest coverage. Even real-time systems that can be replicated and run in parallel, and that have reliable set-up and operations features provide an excellent resource for automated testing. Making detailed predictions for the outcome of such tests can be difficult, and when algorithmic means are employed to produce hundreds or even thousands of cases, generating predicts individually is impractical, and generating predicts with tools requires executable models of the design and environment that themselves require a complete test program. Therefore, evaluating the results of large number of mission scenario tests poses special challenges. A good approach to address this problem is to automatically score the results

  7. Gas Generation from K East Basin Sludges - Series II Testing

    SciTech Connect

    Bryan, Samuel A.; Delegard, Calvin H.; Schmidt, Andrew J.; Sell, Rachel L.; Silvers, Kurt L.; Gano, Susan R.; Thornton, Brenda M.

    2001-03-14

    This report describes work to examine the gas generation behavior of actual K East (KE) Basin floor, pit and canister sludge. Mixed and unmixed and fractionated KE canister sludge were tested, along with floor and pit sludges from areas in the KE Basin not previously sampled. The first report in this series focused on gas generation from KE floor and canister sludge collected using a consolidated sampling technique. The third report will present results of gas generation testing of irradiated uranium fuel fragments with and without sludge addition. The path forward for management of the K Basin Sludge is to retrieve, ship, and store the sludge at T Plant until final processing at some future date. Gas generation will impact the designs and costs of systems associated with retrieval, transportation and storage of sludge.

  8. The use of test structures for reliability prediction and process control of integrated circuits and photovoltaics

    NASA Astrophysics Data System (ADS)

    Trachtenberg, I.

    How a reliability model might be developed with new data from accelerated stress testing, failure mechanisms, process control monitoring, and test structure evaluations is illustrated. The effects of the acceleration of temperature on operating life is discussed. Test structures that will further accelerate the failure rate are discussed. Corrosion testing is addressed. The uncoated structure is encapsulated in a variety of mold compounds and subjected to pressure-cooker testing.

  9. Extended Aging of Ag/W Circuit Breaker Contacts: Influence on Surface Structure, Electrical Properties, and UL Testing Performance

    NASA Astrophysics Data System (ADS)

    Yu, Haibo; Kesim, M. Tumerkan; Sun, Yu; Harmon, Jason; Potter, Jonathan; Alpay, S. Pamir; Aindow, Mark

    2016-01-01

    Samples of 120 V, 30 A commercial circuit breakers were subjected to various aging treatments and the resulting microstructures at the surfaces of the Ag/W contacts were studied using a combination of x-ray diffraction, scanning electron microscopy, and energy-dispersive x-ray spectroscopy techniques. Breakers aged naturally in a hot, humid climate were compared to those subjected to accelerated aging in dry and humid environments. The most extensive oxidation was observed for contacts from breakers subjected to accelerated humid aging; these contacts exhibited thick surface layers consisting of Ag2O, Ag2WO4, Cu(OH)2•H2O, and WO3 phases. Far less surface degradation was observed for dry-aged contacts. Naturally aged contacts showed variations in degradation with more oxidation at the surface regions outside the physical contact area on the contact face. A correlation was found between the contact resistances measured from these samples following ASTM standard B 667-97 and the observed surface microstructures. To evaluate the effects of the surface oxides on breaker performance, humid-aged breakers were subjected to standardized UL overload/temperature-rise, endurance, and short-circuit testing following UL489. The contacts in these breakers exhibit similar microstructural and property changes to those observed previously for as-manufactured contacts after UL testing. These data illustrate the robust performance of this contact technology even after being subjected to aggressive artificial aging.

  10. NASA Fastrac Engine Gas Generator Component Test Program and Results

    NASA Technical Reports Server (NTRS)

    Dennis, Henry J., Jr.; Sanders, Tim; Turner, James E. (Technical Monitor)

    2000-01-01

    This presentation consists of viewgraph which review the test program and the results of the tests for the Gas Generator (GG) component for the Fastrac Engine. Included are pictures of the Fastrac (MC-1) Engine and the GG, diagrams of the flight configuration, and schematics of the LOX, and the RP-1 systems and the injector assembly. The normal operating parameters are reviewed, as are the test instrumentation. Also shown are graphs of the hot gas temperature, and the test temperature profiles. The results are summarized.

  11. Generating realistic environments for cyber operations development, testing, and training

    NASA Astrophysics Data System (ADS)

    Berk, Vincent H.; Gregorio-de Souza, Ian; Murphy, John P.

    2012-06-01

    Training eective cyber operatives requires realistic network environments that incorporate the structural and social complexities representative of the real world. Network trac generators facilitate repeatable experiments for the development, training and testing of cyber operations. However, current network trac generators, ranging from simple load testers to complex frameworks, fail to capture the realism inherent in actual environments. In order to improve the realism of network trac generated by these systems, it is necessary to quantitatively measure the level of realism in generated trac with respect to the environment being mimicked. We categorize realism measures into statistical, content, and behavioral measurements, and propose various metrics that can be applied at each level to indicate how eectively the generated trac mimics the real world.

  12. Measuring circuit

    DOEpatents

    Sun, Shan C.; Chaprnka, Anthony G.

    1977-01-11

    An automatic gain control circuit functions to adjust the magnitude of an input signal supplied to a measuring circuit to a level within the dynamic range of the measuring circuit while a log-ratio circuit adjusts the magnitude of the output signal from the measuring circuit to the level of the input signal and optimizes the signal-to-noise ratio performance of the measuring circuit.

  13. Simulation of TunneLadder traveling-wave tube cold-test characteristics: Implementation of the three-dimensional, electromagnetic circuit analysis code micro-SOS

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Wilson, Jeffrey D.

    1993-01-01

    The three-dimensional, electromagnetic circuit analysis code, Micro-SOS, can be used to reduce expensive time-consuming experimental 'cold-testing' of traveling-wave tube (TWT) circuits. The frequency-phase dispersion characteristics and beam interaction impedance of a TunneLadder traveling-wave tube slow-wave structure were simulated using the code. When reasonable dimensional adjustments are made, computer results agree closely with experimental data. Modifications to the circuit geometry that would make the TunneLadder TWT easier to fabricate for higher frequency operation are explored.

  14. Generating Reduced Tests for FSMs with Extra States

    NASA Astrophysics Data System (ADS)

    Simão, Adenilso; Petrenko, Alexandre; Yevtushenko, Nina

    We address the problem of generating tests from a deterministic Finite State Machine to provide full fault coverage even if the faults may introduce extra states in the implementations. It is well-known that such tests should include the sequences in the so-called traversal set, which contains all sequences of length defined by the number of extra states. Therefore, the only apparent opportunity to produce shorter tests is to find within a test suite a suitable arrangement of the sequences in the inescapable traversal set. We observe that the direct concatenation of the traversal set to a given state cover, suggested by all existing generation methods with full fault coverage, results in extensive test branching, when a test has to be repeatedly executed to apply all the sequences of the traversal set. In this paper, we state conditions which allow distributing these sequences over several tests. We then utilize these conditions to elaborate a method, called SPY-method, which shortens tests by avoiding test branching as much as possible. We present the results of the experimental comparison of the proposed method with an existing method which indicate that the resulting save can be up to 40%.

  15. Nonlinear compensation to enhance the input dynamic range in analog optical fiber links for the high current short circuit test

    NASA Astrophysics Data System (ADS)

    Rodriguez, Joaquin; Garduno, Raul; Velazquez, Jose; Montero, Julio

    2010-06-01

    Due to their galvanic insulation and EMI immunity properties, optical fiber links have been used in the transmitter-receiver system of an analog voltage measuring system at a high-power mid-voltage testing laboratory with a highly aggressive EMI environment. This paper introduces the application of a nonlinear compensation to limit the voltage range at the input of a voltage-controlled oscillator, which is used to produce the pulsed frequency modulation needed to transmit the analog signals over the optical fiber links. The proposed dynamic range compensation system is based on nonlinear circuits to accommodate the input range of the voltage-controlled oscillator. This approach increases the transient signal handling capabilities of the measuring system. This work demonstrates that the nonlinear compensated optical fiber approach yields a unique, electrically isolated, lightning-proof analog data transmission system, for remote measuring systems in the highly aggressive EMI environment of high-power test laboratories.

  16. Flow generation in a novel centrifugal diffuser test device

    NASA Astrophysics Data System (ADS)

    Vidos, P.

    1983-09-01

    Recognition of the need to develop optimum diffusers for advanced centrifugal compressors, resulted in the design and manufacture of a novel low-speed test facility for centrifugal diffuser testing. The CDTD was designed to allow the flow angle and wall boundary profiles into the test diffuser to be controlled by variable geometry in the flow generator. The present study reports on the design of the flow generator and the analysis of the internal flow using a NASA computer code (MERIDL). First test results are given and are compared with the results of a control volume analysis. The flow angle control technique was found to work effectively but to give somewhat smaller angles (by 4 deg) than were predicted. It was concluded that the information obtained would allow scaling of the device; however, an analysis code was needed which would accept the real physical boundary conditions.

  17. Experiments with Test Case Generation and Runtime Analysis

    NASA Technical Reports Server (NTRS)

    Artho, Cyrille; Drusinsky, Doron; Goldberg, Allen; Havelund, Klaus; Lowry, Mike; Pasareanu, Corina; Rosu, Grigore; Visser, Willem; Koga, Dennis (Technical Monitor)

    2003-01-01

    Software testing is typically an ad hoc process where human testers manually write many test inputs and expected test results, perhaps automating their execution in a regression suite. This process is cumbersome and costly. This paper reports preliminary results on an approach to further automate this process. The approach consists of combining automated test case generation based on systematically exploring the program's input domain, with runtime analysis, where execution traces are monitored and verified against temporal logic specifications, or analyzed using advanced algorithms for detecting concurrency errors such as data races and deadlocks. The approach suggests to generate specifications dynamically per input instance rather than statically once-and-for-all. The paper describes experiments with variants of this approach in the context of two examples, a planetary rover controller and a space craft fault protection system.

  18. Next Generation Advanced Video Guidance Sensor Development and Test

    NASA Technical Reports Server (NTRS)

    Howard, Richard T.; Bryan, Thomas C.; Lee, Jimmy; Robertson, Bryan

    2009-01-01

    The Advanced Video Guidance Sensor (AVGS) was the primary docking sensor for the Orbital Express mission. The sensor performed extremely well during the mission, and the technology has been proven on orbit in other flights too. Parts obsolescence issues prevented the construction of more AVGS units, so the next generation of sensor was designed with current parts and updated to support future programs. The Next Generation Advanced Video Guidance Sensor (NGAVGS) has been tested as a breadboard, two different brassboard units, and a prototype. The testing revealed further improvements that could be made and demonstrated capability beyond that ever demonstrated by the sensor on orbit. This paper presents some of the sensor history, parts obsolescence issues, radiation concerns, and software improvements to the NGAVGS. In addition, some of the testing and test results are presented. The NGAVGS has shown that it will meet the general requirements for any space proximity operations or docking need.

  19. Automatic circuit interrupter

    NASA Technical Reports Server (NTRS)

    Dwinell, W. S.

    1979-01-01

    In technique, voice circuits connecting crew's cabin to launch station through umbilical connector disconnect automatically unused, or deadened portion of circuits immediately after vehicle is launched, eliminating possibility that unused wiring interferes with voice communications inside vehicle or need for manual cutoff switch and its associated wiring. Technique is applied to other types of electrical actuation circuits, also launch of mapped vehicles, such as balloons, submarines, test sleds, and test chambers-all requiring assistance of ground crew.

  20. Benzene Generation Testing for Tank 48H Waste Disposition

    SciTech Connect

    Peters, T

    2005-05-13

    In support for the Aggregation option1, researchers performed a series of tests using actual Tank 48H slurries. The tests were designed to examine potential benzene generation issues if the Tank 48H slurry is disposed to Saltstone. Personnel used the archived Tank 48H sample (HTF-E-03-127, collected September 17, 2003) for the experiments. The tests included a series of three experiments (Tests A, B, and F) performed in duplicate, giving a total of six experiments. Test A used Tank 48H slurry mixed with {approx}20:1 with Defense Waste Processing Facility (DWPF) Recycle from Tanks 21H and 22H. Test B used Tank 48H slurry mixed with {approx}2.7:1 with DWPF Recycle from Tanks 21H and 22H, while Test F used Tank 48H slurry as-is. Tests A and B occurred at 45 C, while Test F occurred at 55 C. Over a period of 8 weeks, personnel collected samples for analysis, once per week. Each sample was tested with the in-cell gamma counter. The researchers noted a decline in the cesium activity in solution which is attributed to temperature dependence of the complex slurry equilibrium. Selected samples were sent to ADS for potassium, boron, and cesium analysis. The benzene generation rate was inferred from the TPB destruction which is indirectly measured by the in-growth of cesium, potassium or boron. The results of all the analyses reveal no discernible in-growth of radiocesium, potassium or boron, indicating no significant tetraphenylborate (TPB) decomposition in any of the experiments. From boron measurements, the inferred rate of TPB destruction remained less than 0.332 mg/(L-h) implying a maximum benzene generation rate of <0.325 mg/(L-h).

  1. Guidelines of the Design of Electropyrotechnic Firing Circuit for Unmanned Flight and Ground Test Projects

    NASA Technical Reports Server (NTRS)

    Gonzalez, Guillermo A.; Lucy, Melvin H.; Massie, Jeffrey J.

    2013-01-01

    The NASA Langley Research Center, Engineering Directorate, Electronic System Branch, is responsible for providing pyrotechnic support capabilities to Langley Research Center unmanned flight and ground test projects. These capabilities include device selection, procurement, testing, problem solving, firing system design, fabrication and testing; ground support equipment design, fabrication and testing; checkout procedures and procedure?s training to pyro technicians. This technical memorandum will serve as a guideline for the design, fabrication and testing of electropyrotechnic firing systems. The guidelines will discuss the entire process beginning with requirements definition and ending with development and execution.

  2. Generation of a Periodic Series of High-Power Ultra-Short Pulses in a Gyro-TWT with a Bleachable Cyclotron Absorber in the Feedback Circuit

    NASA Astrophysics Data System (ADS)

    Vilkov, M. N.; Ginzburg, N. S.; Denisov, G. G.; Zotova, I. V.; Sergeev, A. S.

    2016-01-01

    We demonstrate the possibility of forming a periodic series of ultra-short pulses, which has a peak power exceeding significantly the radiation power in stationary regimes, in a gyroresonance traveling-wave tube (gyro-TWT) with a bleachable cyclotron absorber in the feedback circuit. The mechanism of pulsed generation is similar to the method of passive mode locking, which is used widely in laser physics.

  3. Steam generator tube integrity program leak rate tests. Progress report

    SciTech Connect

    Clark, R.A.; Bickford, R.L.

    1984-01-01

    This interim report presents preliminary results on leak rate tests performed on through-wall defected Inconel 600 steam generator tubing. Tube defects included an EDM (electro-discharge machine) notch and IGSCC (intergranular stress corrosion cracks) of various lengths. Tests were conducted at PWR operating temperatures with leakage of hot water/steam into air. A number of IGSCC cracks were unstable under the experiment conditions of these initial tests, continuing to grow until system capacity limitations resulted in decreased pressure differential. However, initial tesing also pointed to a need for reconfiguration of the test apparatus to sustain increased flow and, more importantly, alter the mode of control. The initial test configuration is based on flow control, with pressure differential across the specimen an independent variable. This often results in pressure increases too rapid to establish the initiation of crack instability. A reconfigured system based on pressure control with flow as an independent parameter is being recommended for future tests.

  4. Pattern Generator for Bench Test of Digital Boards

    NASA Technical Reports Server (NTRS)

    Berkun, Andrew C.; Chu, Anhua J.

    2012-01-01

    All efforts to develop electronic equipment reach a stage where they need a board test station for each board. The SMAP digital system consists of three board types that interact with each other using interfaces with critical timing. Each board needs to be tested individually before combining into the integrated digital electronics system. Each board needs critical timing signals from the others to be able to operate. A bench test system was developed to support test of each board. The test system produces all the outputs of the control and timing unit, and is delivered much earlier than the timing unit. Timing signals are treated as data. A large file is generated containing the state of every timing signal at any instant. This file is streamed out to an IO card, which is wired directly to the device-under-test (DUT) input pins. This provides a flexible test environment that can be adapted to any of the boards required to test in a standalone configuration. The problem of generating the critical timing signals is then transferred from a hardware problem to a software problem where it is more easily dealt with.

  5. Testing and Functions of the J2X Gas Generator

    NASA Technical Reports Server (NTRS)

    Miller, Nicholas

    2009-01-01

    The Ares I, NASA s new solid rocket based crew launch vehicle, is a two stage in line rocket that has made its waytothe forefront of NASA s endeavors. The Ares I s Upper Stage (US) will be propelled by a J-2X engine which is fueled by liquid hydrogen and liquid oxygen. The J-2X is a variation based on two of its predecessor s, the J-2 and J-2S engines. ET50 is providing the design support for hardware required to run tests on the J-2X Gas Generator (GG) that increases the delivery pressure of the supplied combustion fuels that the engine burns. The test area will be running a series of tests using different lengths and curved segments of pipe and different sized nozzles to determine the configuration that best satisfies the thrust, heat, and stability requirements for the engine. I have had to research the configurations that are being tested and gain an understanding of the purpose of the tests. I then had to research the parts that would be used in the test configurations. I was taken to see parts similar to the ones used in the test configurations and was allowed to review drawings and dimensions used for those parts. My job over this summer has been to use the knowledge I have gained to design, model, and create drawings for the un-fabricated parts that are necessary for the J-2X Workhorse Gas Generator Phase IIcTest.

  6. Regenerative feedback resonant circuit

    DOEpatents

    Jones, A. Mark; Kelly, James F.; McCloy, John S.; McMakin, Douglas L.

    2014-09-02

    A regenerative feedback resonant circuit for measuring a transient response in a loop is disclosed. The circuit includes an amplifier for generating a signal in the loop. The circuit further includes a resonator having a resonant cavity and a material located within the cavity. The signal sent into the resonator produces a resonant frequency. A variation of the resonant frequency due to perturbations in electromagnetic properties of the material is measured.

  7. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  8. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  9. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  10. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  11. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  12. Testing a Student Generated Hypothesis Using Student Data

    ERIC Educational Resources Information Center

    McGowan, Herle M.; Vaughan, Joel

    2012-01-01

    We describe an activity that allows students to experience the full process of a statistical investigation, from generating the research question, to collecting data and testing a hypothesis. Implementation of the activity is described both with and without use of clickers, handheld remotes that allow instant data collection.

  13. Automatic Generation of Tests from Domain and Multimedia Ontologies

    ERIC Educational Resources Information Center

    Papasalouros, Andreas; Kotis, Konstantinos; Kanaris, Konstantinos

    2011-01-01

    The aim of this article is to present an approach for generating tests in an automatic way. Although other methods have been already reported in the literature, the proposed approach is based on ontologies, representing both domain and multimedia knowledge. The article also reports on a prototype implementation of this approach, which…

  14. Closed cycle cryocooler for low temperature electronics circuits: Cold end test

    NASA Astrophysics Data System (ADS)

    Pirtle, F. W.

    1983-08-01

    A fabricated MACOR cold end including a metallic coating to prevent helium permeation and a fabricated die post displacer support bearing were combined with a compressor and motor which are standard CTI-CRYOGENICS products. A mechanical test was performed on the test cryocooler to determine that the mechanical test was performed on the test cryocooler to determine that the MACOR displacer was successfully guided by the die post bearing. Thermodynamic tests were conducted to determine the lowest temperature of the 4th (coldest) stage as a function of operating speed, helium charge pressure, 4th stage electrical heat load, and transfer tube diameter. Cooldown and steady state results are reported. Results indicate a low temperature limit of approximately 95K with the current test hardware. Although this represents an improvement from 122K during the program, a resizing will be necessary to reach 10K. The die post displacer support bearing and the MACOR cold finger construction are mechanically satisfactory.

  15. Quantum random number generation for loophole-free Bell tests

    NASA Astrophysics Data System (ADS)

    Mitchell, Morgan; Abellan, Carlos; Amaya, Waldimar

    2015-05-01

    We describe the generation of quantum random numbers at multi-Gbps rates, combined with real-time randomness extraction, to give very high purity random numbers based on quantum events at most tens of ns in the past. The system satisfies the stringent requirements of quantum non-locality tests that aim to close the timing loophole. We describe the generation mechanism using spontaneous-emission-driven phase diffusion in a semiconductor laser, digitization, and extraction by parity calculation using multi-GHz logic chips. We pay special attention to experimental proof of the quality of the random numbers and analysis of the randomness extraction. In contrast to widely-used models of randomness generators in the computer science literature, we argue that randomness generation by spontaneous emission can be extracted from a single source.

  16. Ground and CHAMP observations of field-aligned current circuits generated by lower atmospheric disturbances and expectations to the SWARM to clarify their three dimensional structure

    NASA Astrophysics Data System (ADS)

    Iyemori, Toshihiko; Nakanishi, Kunihito; Aoyama, Tadashi; Lühr, Hermann

    2014-05-01

    Acoustic gravity waves propagated to the ionosphere cause dynamo currents in the ionosphere. They divert along geomagnetic field lines of force to another hemisphere accompanying electric field and then flow in the ionosphere of another hemisphere by the electric field forming closed current circuits. The oscillating current circuits with the period of acoustic waves generate magnetic variations on the ground, and they are observed as long period geomagnetic pulsations. This effect has been detected during big earthquakes, strong typhoons, tornados etc. On a low-altitude satellite orbit, the spatial distribution (i.e., structure) of the current circuits along the satellite orbit should be detected as temporal magnetic oscillations, and the effect is confirmed by a CHAMP data analysis. On the spatial structure, in particular, in the longitudinal direction, it has been difficult to examine by a single satellite or from ground magnetic observations. The SWARM satellites will provide an unique opportunity to clarify the three dimensional structure of the field-aligned current circuits.

  17. Automated Test Case Generation for an Autopilot Requirement Prototype

    NASA Technical Reports Server (NTRS)

    Giannakopoulou, Dimitra; Rungta, Neha; Feary, Michael

    2011-01-01

    Designing safety-critical automation with robust human interaction is a difficult task that is susceptible to a number of known Human-Automation Interaction (HAI) vulnerabilities. It is therefore essential to develop automated tools that provide support both in the design and rapid evaluation of such automation. The Automation Design and Evaluation Prototyping Toolset (ADEPT) enables the rapid development of an executable specification for automation behavior and user interaction. ADEPT supports a number of analysis capabilities, thus enabling the detection of HAI vulnerabilities early in the design process, when modifications are less costly. In this paper, we advocate the introduction of a new capability to model-based prototyping tools such as ADEPT. The new capability is based on symbolic execution that allows us to automatically generate quality test suites based on the system design. Symbolic execution is used to generate both user input and test oracles user input drives the testing of the system implementation, and test oracles ensure that the system behaves as designed. We present early results in the context of a component in the Autopilot system modeled in ADEPT, and discuss the challenges of test case generation in the HAI domain.

  18. Experimental laboratory system to generate high frequency test environments

    SciTech Connect

    Gregory, D.L.; Paez, T.L.

    1991-01-01

    This is an extension of two previous analytical studies to investigate a technique for generating high frequency, high amplitude vibration environments. These environments are created using a device attached to a common vibration exciter that permits multiple metal on metal impacts driving a test surface. These analytical studies predicted that test environments with an energy content exceeding 10 kHz could be achieved using sinusoidal and random shaker excitations. The analysis predicted that chaotic vibrations yielding random like test environments could be generated from sinusoidal inputs. In this study, a much simplified version of the proposed system was fabricated and tested in the laboratory. Experimental measurements demonstrate that even this simplified system, utilizing a single impacting object, can generate environments on the test surface with significant frequency content in excess of 40 kHz. Results for sinusoidal shaker inputs tuned to create chaotic impact response are shown along with the responses due to random vibration shaker inputs. The experiments and results are discussed. 4 refs., 5 figs.

  19. Developing the Persian version of the homophone meaning generation test

    PubMed Central

    Ebrahimipour, Mona; Motamed, Mohammad Reza; Ashayeri, Hassan; Modarresi, Yahya; Kamali, Mohammad

    2016-01-01

    Background: Finding the right word is a necessity in communication, and its evaluation has always been a challenging clinical issue, suggesting the need for valid and reliable measurements. The Homophone Meaning Generation Test (HMGT) can measure the ability to switch between verbal concepts, which is required in word retrieval. The purpose of this study was to adapt and validate the Persian version of the HMGT. Methods: The first phase involved the adaptation of the HMGT to the Persian language. The second phase concerned the psychometric testing. The word-finding performance was assessed in 90 Persian-speaking healthy individuals (20-50 year old; 45 males and 45 females) through three naming tasks: Semantic Fluency, Phonemic Fluency, and Homophone Meaning Generation Test. The participants had no history of neurological or psychiatric diseases, alcohol abuse, severe depression, or history of speech, language, or learning problems. Results: The internal consistency coefficient was larger than 0.8 for all the items with a total Cronbach’s alpha of 0.80. Interrater and intrarater reliability were also excellent. The validity of all items was above 0.77, and the content validity index (0.99) was appropriate. The Persian HMGT had strong convergent validity with semantic and phonemic switching and adequate divergent validity with semantic and phonemic clustering. Conclusion: The Persian version of the Homophone Meaning Generation Test is an appropriate, valid, and reliable test to evaluate the ability to switch between verbal concepts in the assessment of word-finding performance. PMID:27390705

  20. Improved ant algorithms for software testing cases generation.

    PubMed

    Yang, Shunkun; Man, Tianlong; Xu, Jiaqi

    2014-01-01

    Existing ant colony optimization (ACO) for software testing cases generation is a very popular domain in software testing engineering. However, the traditional ACO has flaws, as early search pheromone is relatively scarce, search efficiency is low, search model is too simple, positive feedback mechanism is easy to produce the phenomenon of stagnation and precocity. This paper introduces improved ACO for software testing cases generation: improved local pheromone update strategy for ant colony optimization, improved pheromone volatilization coefficient for ant colony optimization (IPVACO), and improved the global path pheromone update strategy for ant colony optimization (IGPACO). At last, we put forward a comprehensive improved ant colony optimization (ACIACO), which is based on all the above three methods. The proposed technique will be compared with random algorithm (RND) and genetic algorithm (GA) in terms of both efficiency and coverage. The results indicate that the improved method can effectively improve the search efficiency, restrain precocity, promote case coverage, and reduce the number of iterations. PMID:24883391

  1. Solar Stirling power generation - Systems analysis and preliminary tests

    NASA Technical Reports Server (NTRS)

    Selcuk, M. K.; Wu, Y.-C.; Moynihan, P. I.; Day, F. D., III

    1977-01-01

    The feasibility of an electric power generation system utilizing a sun-tracking parabolic concentrator and a Stirling engine/linear alternator is being evaluated. Performance predictions and cost analysis of a proposed large distributed system are discussed. Design details and preliminary test results are presented for a 9.5 ft diameter parabolic dish at the Jet Propulsion Laboratory (Caltech) Table Mountain Test Facility. Low temperature calorimetric measurements were conducted to evaluate the concentrator performance, and a helium flow system is being used to test the solar receiver at anticipated working fluid temperatures (up to 650 or 1200 C) to evaluate the receiver thermal performance. The receiver body is designed to adapt to a free-piston Stirling engine which powers a linear alternator assembly for direct electric power generation. During the next phase of the program, experiments with an engine and receiver integrated into the concentrator assembly are planned.

  2. Improved Ant Algorithms for Software Testing Cases Generation

    PubMed Central

    Yang, Shunkun; Xu, Jiaqi

    2014-01-01

    Existing ant colony optimization (ACO) for software testing cases generation is a very popular domain in software testing engineering. However, the traditional ACO has flaws, as early search pheromone is relatively scarce, search efficiency is low, search model is too simple, positive feedback mechanism is easy to porduce the phenomenon of stagnation and precocity. This paper introduces improved ACO for software testing cases generation: improved local pheromone update strategy for ant colony optimization, improved pheromone volatilization coefficient for ant colony optimization (IPVACO), and improved the global path pheromone update strategy for ant colony optimization (IGPACO). At last, we put forward a comprehensive improved ant colony optimization (ACIACO), which is based on all the above three methods. The proposed technique will be compared with random algorithm (RND) and genetic algorithm (GA) in terms of both efficiency and coverage. The results indicate that the improved method can effectively improve the search efficiency, restrain precocity, promote case coverage, and reduce the number of iterations. PMID:24883391

  3. Elevated voltage level I.sub.DDQ failure testing of integrated circuits

    DOEpatents

    Righter, Alan W.

    1996-01-01

    Burn in testing of static CMOS IC's is eliminated by I.sub.DDQ testing at elevated voltage levels. These voltage levels are at least 25% higher than the normal operating voltage for the IC but are below voltage levels that would cause damage to the chip.

  4. Elevated voltage level I{sub DDQ} failure testing of integrated circuits

    DOEpatents

    Righter, A.W.

    1996-05-21

    Burn in testing of static CMOS IC`s is eliminated by I{sub DDQ} testing at elevated voltage levels. These voltage levels are at least 25% higher than the normal operating voltage for the IC but are below voltage levels that would cause damage to the chip. 4 figs.

  5. Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 1: Tests with open circuits

    NASA Technical Reports Server (NTRS)

    Barna, P. Stephen

    1991-01-01

    This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period of November 1989 to December 1990. Throughout the testing the tunnel was operated in the 'open circuit mode', that is when the airflow was induced by a powerful exhaust fan located outside the tunnel circuit. The tests were first performed with the closed test section and were subsequently repeated with the open test section. While operating with the open test section, a novel device, called the 'nozzle-diffuser,' was also tested in order to establish its usefulness of increasing pressure recovery in the first diffuser. The tests established the viability of the tunnel design. The flow distribution in each tunnel component was found acceptable and pressure recovery in the diffusers were found satisfactory. The diffusers appeared to operate without flow separation. All tests were performed at NASA LaRC.

  6. Gas Generation from K East Basin Sludges - Series I Testing

    SciTech Connect

    Delegard, Calvin H.; Bryan, Samuel A.; Schmidt, Andrew J.; Bredt, Paul R.; King, Christopher M.; Sell, Rachel L.; Burger, Leland L.; Silvers, Kurt L.

    2000-09-12

    This report describes work to examine the gas generation behavior of actual K East (KE) Basin floor and canister sludge. The path forward for management of the K Basin Sludge is to retrieve, ship, and store the sludge at T Plant until final processing at some future date. Gas generation will impact the designs and costs of systems associated with retrieval, transportation and storage of sludge. The overall goals for this testing were to collect detailed gas generation rate and composition data to ascertain the quantity and reactivity of the metallic uranium (and other reactive species) present in the K Basin sludge. The gas generation evaluation included four large-scale vessels (850 ml) and eight small-scale vessels (30 ml) in an all-metal, leak tight system. The tests were conducted for several thousand hours at ambient and elevated temperatures (32 C, 40 C, 60 C, 80 C, and 95 C) to accelerated the reactions and provide conclusive gas generation data within a reasonable testing period. The sludge used for these tests was collected from the KE Basin floor and canister barrels (containing damaged spent fuel elements) using a consolidated sampling technique (i.e., material from several locations was combined to form ''consolidated samples''). Portions of these samples were sieved to separate particles greater than 250 m (P250) from particle less than 250 m (M250). This separation was performed to mimic the separation operations that are planned during the retrieval of certain K Basin sludge types and to gain a better understanding of how uranium metal is distributed in the sludge. The corrosion rate of the uranium metal particles in the sludge was found to agree reasonably well with corrosion rates reported in the literature.

  7. Single event upset test structures for digital CMOS application specific integrated circuits

    SciTech Connect

    Baze, M.P.; Bartholet, W.G.; Braatz, J.C.; Dao, T.A. )

    1993-12-01

    An approach has been developed for the design and utilization of SEU test structures for digital CMOS ASICs. This approach minimizes the number of test structures required by categorizing ASIC library cells according to their SEU response and designing a structure to characterize each response for each category. Critical SEU response parameters extracted from these structures are used to evaluate the SEU hardness of ASIC libraries and predict the hardness of ASIC chips.

  8. NASA Fastrac Engine Gas Generator Component Test Program and Results

    NASA Technical Reports Server (NTRS)

    Dennis, Henry J., Jr.; Sanders, T.

    2000-01-01

    Low cost access to space has been a long-time goal of the National Aeronautics and Space Administration (NASA). The Fastrac engine program was begun at NASA's Marshall Space Flight Center to develop a 60,000-pound (60K) thrust, liquid oxygen/hydrocarbon (LOX/RP), gas generator-cycle booster engine for a fraction of the cost of similar engines in existence. To achieve this goal, off-the-shelf components and readily available materials and processes would have to be used. This paper will present the Fastrac gas generator (GG) design and the component level hot-fire test program and results. The Fastrac GG is a simple, 4-piece design that uses well-defined materials and processes for fabrication. Thirty-seven component level hot-fire tests were conducted at MSFC's component test stand #116 (TS116) during 1997 and 1998. The GG was operated at all expected operating ranges of the Fastrac engine. Some minor design changes were required to successfully complete the test program as development issues arose during the testing. The test program data results and conclusions determined that the Fastrac GG design was well on the way to meeting the requirements of NASA's X-34 Pathfinder Program that chose the Fastrac engine as its main propulsion system.

  9. A Low Impedance Marx Generator as a Test bed for Vacuum Diodes

    NASA Astrophysics Data System (ADS)

    Adhikary, Biswajit; Deb, P.; Verma, R.; Shukla, R.; Sharma, S. K.; Banerjee, P.; Das, R.; Prabaharan, T.; Das, B. K.; Shyam, Anurag

    2012-11-01

    A low impedance Marx generator was developed, which will serve as a test bed for Vacuum diodes of various electrode materials and geometries. The vacuum diodes will be used for high power microwave generation. The generator is capable to supply ~3GW of pulsed power to the vacuum diodes which is sufficient enough to produce plasma within the diode for electron beam generation. A vacuum of 10-5Torr is required for virtual cathode formation within the diode, when the beam current exceeds the space charge limiting current. A vacuum diode of reflex triode geometry has been designed and vacuum of 10-5 Torr has been achieved. The repetitive operation of the vacuum diode depends upon the recovery of the diode, the importance of the vacuum system on the recovery of the diode will be explained. A vacuum system with high voltage isolator has been installed for getting the desired vacuum within the diode. The design criterion of the vacuum system will be discussed. The 300kV/1.8kJ Marx generator which will power the vacuum diode has six stages with stage capacitance and voltage of 240nF and 50kV respectively. It has an impedance of ~7 ohm and can deliver 200kV voltage across the diode in critically damped load condition. The generator has a very fast rise time of 200ns.The operational characteristics of the Marx generator are determined experimentally. The results have been analyzed and compared to an equivalent circuit model of the system.

  10. Automated ILA design for synchronous sequential circuits

    NASA Technical Reports Server (NTRS)

    Liu, M. N.; Liu, K. Z.; Maki, G. K.; Whitaker, S. R.

    1991-01-01

    An iterative logic array (ILA) architecture for synchronous sequential circuits is presented. This technique utilizes linear algebra to produce the design equations. The ILA realization of synchronous sequential logic can be fully automated with a computer program. A programmable design procedure is proposed to fullfill the design task and layout generation. A software algorithm in the C language has been developed and tested to generate 1 micron CMOS layouts using the Hewlett-Packard FUNGEN module generator shell.

  11. Clinch River Breeder Reactor Plant Steam Generator Few Tube Test model post-test examination

    SciTech Connect

    Impellezzeri, J.R.; Camaret, T.L.; Friske, W.H.

    1981-03-11

    The Steam Generator Few Tube Test (FTT) was part of an extensive testing program carried out in support of the Clinch River Breeder Reactor Plant (CRBRP) steam generator design. The testing of full-length seven-tube evaporator and three-tube superheater models of the CRBRP design was conducted to provide steady-state thermal/hydraulic performance data to full power per tube and to verify the absence of multi-year endurance problems. This paper describes the problems encountered with the mechanical features of the FTT model design which led to premature test termination, and the results of the post-test examination. Conditions of tube bowing and significant tube and tube support gouging was observed. An interpretation of the visual and metallurgical observations is also presented. The CRBRP steam generator has undergone design evaluations to resolve observed deficiences found in the FFTM.

  12. Acceptance Test Plan for Fourth-Generation Corrosion Monitoring Cabinet

    SciTech Connect

    NORMAN, E.C.

    2000-10-23

    This Acceptance Test Plan (ATP) will document the satisfactory operation of the third-generation corrosion monitoring cabinet (Hiline Engineering Part No.0004-CHM-072-C01). This ATP will be performed by the manufacturer of the cabinet prior to delivery to the site. The objective of this procedure is to demonstrate and document the acceptance of the corrosion monitoring cabinet. The test will consist of a continuity test of the cabinet wiring from the end of cable to be connected to corrosion probe, through the appropriate intrinsic safety barriers and out to the 15 pin D-shell connectors to be connected to the corrosion monitoring instrument. Additional testing will be performed using a constant current and voltage source provided by the corrosion monitoring hardware manufacturer to verify proper operation of corrosion monitoring instrumentation.

  13. A test vector generator for a radar signal processor

    NASA Astrophysics Data System (ADS)

    Robins, C. B.

    1991-02-01

    This report documents the test vector generator (TVG) system developed for the purpose of testing a radar signal processor. This system simulates an eight channel radar receiver by providing input data for testing the signal processor test bed. The TVG system outputs 128-bit wide data samples at variable rates up to and including 10 million samples per second. The VTG memory array is one million samples deep. Variably sized output vectors can be addressed within the memory array and the vectors can be concatenated, repeated, and reshuffled in real time under the control of a single board computer. The TVG is seen having applications on a variety of programs. Discussions of adapting and scaling the system to these other applications are presented.

  14. Generation of Simulated Tracking Data for LADEE Operational Readiness Testing

    NASA Technical Reports Server (NTRS)

    Woodburn, James; Policastri, Lisa; Owens, Brandon

    2015-01-01

    Operational Readiness Tests were an important part of the pre-launch preparation for the LADEE mission. The generation of simulated tracking data to stress the Flight Dynamics System and the Flight Dynamics Team was important for satisfying the testing goal of demonstrating that the software and the team were ready to fly the operational mission. The simulated tracking was generated in a manner to incorporate the effects of errors in the baseline dynamical model, errors in maneuver execution and phenomenology associated with various tracking system based components. The ability of the mission team to overcome these challenges in a realistic flight dynamics scenario indicated that the team and flight dynamics system were ready to fly the LADEE mission. Lunar Atmosphere and Dust Environment.

  15. Automatic Generation of Test Oracles - From Pilot Studies to Application

    NASA Technical Reports Server (NTRS)

    Feather, Martin S.; Smith, Ben

    1998-01-01

    There is a trend towards the increased use of automation in V&V. Automation can yield savings in time and effort. For critical systems, where thorough V&V is required, these savings can be substantial. We describe a progression from pilot studies to development and use of V&V automation. We used pilot studies to ascertain opportunities for, and suitability of, automating various analyses whose results would contribute to V&V. These studies culminated in the development of an automatic generator of automated test oracles. This was then applied and extended in the course of testing an Al planning system that is a key component of an autonomous spacecraft.

  16. Facility for generating crew waste water product for ECLSS testing

    NASA Technical Reports Server (NTRS)

    Buitekant, Alan; Roberts, Barry C.

    1990-01-01

    An End-use Equipment Facility (EEF) has been constructed which is used to simulate water interfaces between the Space Station Freedom Environmental Control and Life Support Systems (ECLSS) and man systems. The EEF is used to generate waste water to be treated by ECLSS water recovery systems. The EEF will also be used to close the water recovery loop by allowing test subjects to use recovered hygiene and potable water during several phases of testing. This paper describes the design and basic operation of the EEF.

  17. NREL Next Generation Drivetrain: Mechanical Design and Test Plan (Poster)

    SciTech Connect

    Keller, J.; Halse, C.

    2014-05-01

    The Department of Energy and industry partners are sponsoring a $3m project for design and testing of a 'Next Generation' wind turbine drivetrain at the National Renewable Energy Laboratory (NREL). This poster focuses on innovative aspects of the gearbox design, completed as part of an end-to-end systems engineering approach incorporating innovations that increase drivetrain reliability, efficiency, torque density and minimize capital cost.

  18. Shape matching utilizing indexed hypotheses generation and testing

    NASA Technical Reports Server (NTRS)

    Mehrotra, Rajiv; Grosky, William I.

    1989-01-01

    An indexing mechanism is developed as part of an overall scheme called SMITH (shape matching utilizing indexed hypothesis generation and testing) for two-dimensional model-based object recognition. The approach is based on a dynamic programming implementation of attributed string matching, is computationally efficient, and works effectively for both nonoccluded and occluded shapes. Another advantage of this technique is that models may be inserted or deleted with relatively little cost.

  19. Gas Generation from K East Basin Sludges - Series II Testing

    SciTech Connect

    Bryan, Samuel A.; Delegard, Calvin H.; Schmidt, Andrew J.; Sell, Rachel L.; Silvers, Kurt L.; Gano, Susan R.; Thornton, Brenda M.

    2004-04-26

    This report describes work to examine the gas generation behavior of actual K East (KE) Basin floor, pit and canister sludge. Mixed and unmixed and fractionated KE canister sludge were tested, along with floor and pit sludges from areas in the KE Basin not previously sampled. The first report in this series focuses on gas generation from KE floor and canister sludge collected using a consolidated sampling technique. The third report presents results of gas generation testing of irradiated uranium fuel fragments with and without sludge addition. The path forward for management of the K Basin Sludge is to retrieve, ship, and store the sludge at T Plant until final processing at some future date. Gas generation will impact the designs and costs of systems associated with retrieval, transportation and storage of sludge. This report was originally published in March 2001. In January 2004, a transcription error was discovered in the value reported for the uranium metal content of KE North Loadout Pit sample FE-3. This revision of the report corrects the U metal content of FE-3 from 0.0013 wt% to 0.013 wt%.

  20. Universal test fixture for monolithic mm-wave integrated circuits calibrated with an augmented TRD algorithm

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert R.; Shalkhauser, Kurt A.

    1989-01-01

    The design and evaluation of a novel fixturing technique for characterizing millimeter wave solid state devices is presented. The technique utilizes a cosine-tapered ridge guide fixture and a one-tier de-embedding procedure to produce accurate and repeatable device level data. Advanced features of this technique include nondestructive testing, full waveguide bandwidth operation, universality of application, and rapid, yet repeatable, chip-level characterization. In addition, only one set of calibration standards is required regardless of the device geometry.

  1. Greater Utilization of Neural-Circuits Related to Executive Functions is Associated with Better Reading: A Longitudinal fMRI Study Using the Verb Generation Task

    PubMed Central

    Horowitz-Kraus, Tzipi; Vannest, Jennifer J.; Gozdas, Elveda; Holland, Scott K.

    2014-01-01

    Introduction: Reading is an acquired-developmental ability that relies on intact language and executive function skills. Verbal fluency tasks (such as verb generation) also engage language and executive function skills. Performance of such tasks matures with normal language development, and is independent of reading proficiency. In this longitudinal fMRI study, we aim to examine the association between maturation of neural-circuits supporting both executive functions and language (assessed using verb generation) with reading proficiency achieved in adolescence with a focus on left-lateralization typical for language proficiency. Methods: Normalized fMRI data from the verb generation task was collected from 16 healthy children at ages 7, 11, and 17 years and was correlated with reading scores at 17 years of age. Lateralization indices were calculated in key language, reading, and executive function-related regions in all age groups. Results: Typical development was associated with (i) increasingly left-lateralized patterns in language regions (ii) more profound left-lateralized activation for reading and executive function-related regions when correlating with reading scores, (iii) greater involvement of frontal and parietal regions (in older children), and of the anterior frontal cortex (in younger children). Conclusion: We suggest that reading and verb generation share mutual neural-circuits during development with major reliance on regions related to executive functions and reading. The results are discussed in the context of the dual-networks architecture model. PMID:24999322

  2. Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods

    NASA Technical Reports Server (NTRS)

    Johnson, G. M.

    1976-01-01

    The application of high temperature accelerated test techniques was shown to be an effective method of microcircuit defect screening. Comprehensive microcircuit evaluations and a series of high temperature (473 K to 573 K) life tests demonstrated that a freak or early failure population of surface contaminated devices could be completely screened in thirty two hours of test at an ambient temperature of 523 K. Equivalent screening at 398 K, as prescribed by current Military and NASA specifications, would have required in excess of 1,500 hours of test. All testing was accomplished with a Texas Instruments' 54L10, low power triple-3 input NAND gate manufactured with a titanium- tungsten (Ti-W), Gold (Au) metallization system. A number of design and/or manufacturing anomalies were also noted with the Ti-W, Au metallization system. Further study of the exact nature and cause(s) of these anomalies is recommended prior to the use of microcircuits with Ti-W, Au metallization in long life/high reliability applications. Photomicrographs of tested circuits are included.

  3. LOGIC CIRCUIT

    DOEpatents

    Strong, G.H.; Faught, M.L.

    1963-12-24

    A device for safety rod counting in a nuclear reactor is described. A Wheatstone bridge circuit is adapted to prevent de-energizing the hopper coils of a ball backup system if safety rods, sufficient in total control effect, properly enter the reactor core to effect shut down. A plurality of resistances form one arm of the bridge, each resistance being associated with a particular safety rod and weighted in value according to the control effect of the particular safety rod. Switching means are used to switch each of the resistances in and out of the bridge circuit responsive to the presence of a particular safety rod in its effective position in the reactor core and responsive to the attainment of a predetermined velocity by a particular safety rod enroute to its effective position. The bridge is unbalanced in one direction during normal reactor operation prior to the generation of a scram signal and the switching means and resistances are adapted to unbalance the bridge in the opposite direction if the safety rods produce a predetermined amount of control effect in response to the scram signal. The bridge unbalance reversal is then utilized to prevent the actuation of the ball backup system, or, conversely, a failure of the safety rods to produce the predetermined effect produces no unbalance reversal and the ball backup system is actuated. (AEC)

  4. A self-testing method of large analog circuits in electronic embedded systems

    NASA Astrophysics Data System (ADS)

    Czaja, Z.

    2010-07-01

    A new self-testing method of high-order filters consisting of a chain of first- or second-order filter units of mixed-signal electronic embedded systems controlled by microcontrollers or DSPs is presented in the paper. The main idea of the method bases on the fact that the signal response of the given filter unit is treated as the signal stimulation of the next filter unit. Thanks to this, a simple reconfigurable BIST consisting of only internal devices of the microcontroller controlling the system was obtained.

  5. Implications of angle of incidence in SEU testing of modern circuits

    SciTech Connect

    Reed, R.A.; McNulty, P.J.; Abdel-Kadar, W.G. . Dept. of Physics and Astronomy)

    1994-12-01

    Simulations show that ignoring the angular dependence of proton SEU cross sections produces errors in predictions of SEU rates in space. Moreover, they suggest that devices with thin sensitive volumes may upset to protons at grazing incidence despite high threshold LET values (> 80 MeV cm[sup 2]) at normal incidence. Incorporating angular effects in space predictions requires accurate knowledge of the dimensions of the sensitive volume associated with the SEU-sensitive junction, especially the thickness. A method is proposed for using proton SEU measurements at different angles and energies combined with simulations to determine the thickness of the sensitive volume and to test the reliability of the predictions.

  6. Development of nondestructive testing techniques for plated-through holes in multilayer printed circuit boards

    NASA Technical Reports Server (NTRS)

    Anthony, P. L.; Mcmurtrey, J. E.

    1971-01-01

    The development of a nondestructive test with the capability to interrogate plated-through holes as small as 0.51 millimeters inside diameter is discussed. The system can detect defects such as holes, voids, cracks, and thin spots that reduce the current carrying capability of plates-through interconnects by 20 percent or more. Efforts were directed toward the design and fabrication of magnetic circuitry mutual coupling probes and to evaluate the effectiveness of these devices for detecting in multilayer board plated-through holes.

  7. D0 Experimental Area Emergency Backup Power and Generator Test

    SciTech Connect

    Markley, D.; /Fermilab

    1991-01-24

    The DO experimental area has a generator designated as emergency power. This generator provides power for critical loads and starts automatically upon loss of commercial power. This note concerns the testing of this generator. A list of loads is attached to this note. One of the loads on the emergency power grid is a 10KVA Uninterruptable Power Supply(UPS). The UPS powers the cryogenic controls and Oxygen deficiency hazard equipment(ODH) and has a minimum rating of 20 minutes while on its batteries(to cover the transfer time to/from the emergency generator). Jan 23,1991 at 1640 hrs this system was tested under the supervision of the Terry Ross, Marv Johnson, Dan Markley, Kelly Dixon, and John Urbin. The power feeder to the emergency power grid at DO was disconnected. The generator responded immediately and was supplying power to the emergency power grid in less than 10 seconds. During the 10 seconds that there was no power on the emergency grid the UPS switched on its inverter and provided uninterrupted power to the cryogenic control system and the ODH system. All of the motorized equipment shut off instrument air compressor, vacuum pumps 1 and 2, insulating vacuum blower, glycol cooling pumps, cooling tower fan, and Exhaust Fan 7(EF7). Upon reengagement of power to the grid from the emergency generator, all of the motorized loads started back up with the exception of vacuum pumps 1 and 2, and the UPS inverter turned off. Vacuum pumps 1 and 2 were delay started 20 seconds by the cryogenic control system as not to cause too large of a surge in power by all of the inductive loads starting at once. The DO building elevator which is also on emergency power was test run while the emergency generator was on line with all other emergency loads. The emergency generator current was 140 amps with all loads on line and running except the building elevator. This load of 140 amps is 27% of the generator's capacity. The cryogenic control and ODH system continued to function

  8. Investigation of multilayer printed circuit board (PCB) film warpage using viscoelastic properties measured by a vibration test

    NASA Astrophysics Data System (ADS)

    Joo, Sung-Jun; Park, Buhm; Kim, Do-Hyoung; Kwak, Dong-Ok; Song, In-Sang; Park, Junhong; Kim, Hak-Sung

    2015-03-01

    Woven glass fabric/BT (bismaleimide triazine) composite laminate (BT core), copper (Cu), and photoimageable solder resist (PSR) are the most widely used materials for semiconductors in electronic devices. Among these materials, BT core and PSR contain polymeric materials that exhibit viscoelastic behavior. For this reason, these materials are considered to have time- and temperature-dependent moduli during warpage analysis. However, the thin geometry of multilayer printed circuit board (PCB) film makes it difficult to identify viscoelastic characteristics. In this work, a vibration test method was proposed for measuring the viscoelastic properties of a multilayer PCB film at different temperatures. The beam-shaped specimens, composed of a BT core, Cu laminated on a BT core, and PSR and Cu laminated on a BT core, were used in the vibration test. The frequency-dependent variation of the complex bending stiffness was determined using a transfer function method. The storage modulus (E‧) of the BT core, Cu, and PSR as a function of temperature and frequency were obtained, and their temperature-dependent variation was identified. The obtained properties were fitted using a viscoelastic model for the BT core and the PSR, and a linear elastic model for the Cu. Warpage of a line pattern specimen due to temperature variation was measured using a shadow Moiré analysis and compared to predictions using a finite element model. The results provide information on the mechanism of warpage, especially warpage due to temperature-dependent variation in viscoelastic properties.

  9. Ion Beam Induced Charge Collection (IBICC) from Integrated Circuit Test Structures Using a 10 MeV Carbon Microbeam

    SciTech Connect

    Aton, T.J.; Doyle, B.L.; Duggan, J.L.; El Bouanani, M.; Guo, B.N.; McDaniel, F.D.; Renfrow, S.N.; Walsh, D.S.

    1998-11-18

    As future sizes of Integrated Circuits (ICs) continue to shrink the sensitivity of these devices, particularly SRAMs and DRAMs, to natural radiation is increasing. In this paper, the Ion Beam Induced Charge Collection (IBICC) technique is utilized to simulate neutron-induced Si recoil effects in ICS. The IBICC measurements, conducted at the Sandia National Laboratories employed a 10 MeV carbon microbeam with 1pm diameter spot to scan test structures on specifically designed ICS. With the aid of layout information, an analysis of the charge collection efficiency from different test areas is presented. In the present work a 10 MeV Carbon high-resolution microbeam was used to demonstrate the differential charge collection efficiency in ICS with the aid of the IC design Information. When ions strike outside the FET, the charge was only measured on the outer ring, and decreased with strike distance from this diode. When ions directly strike the inner and ring diodes, the collected charge was localized to these diodes. The charge for ions striking the gate region was shared between the inner and ring diodes. I The IBICC measurements directly confirmed the interpretations made in the earlier work.

  10. Achieving Maximum Power from Thermoelectric Generators with Maximum-Power-Point-Tracking Circuits Composed of a Boost-Cascaded-with-Buck Converter

    NASA Astrophysics Data System (ADS)

    Park, Hyunbin; Sim, Minseob; Kim, Shiho

    2015-06-01

    We propose a way of achieving maximum power and power-transfer efficiency from thermoelectric generators by optimized selection of maximum-power-point-tracking (MPPT) circuits composed of a boost-cascaded-with-buck converter. We investigated the effect of switch resistance on the MPPT performance of thermoelectric generators. The on-resistances of the switches affect the decrease in the conversion gain and reduce the maximum output power obtainable. Although the incremental values of the switch resistances are small, the resulting difference in the maximum duty ratio between the input and output powers is significant. For an MPPT controller composed of a boost converter with a practical nonideal switch, we need to monitor the output power instead of the input power to track the maximum power point of the thermoelectric generator. We provide a design strategy for MPPT controllers by considering the compromise in which a decrease in switch resistance causes an increase in the parasitic capacitance of the switch.

  11. Investigation, Analysis, and Testing of Self-contained Oxygen Generators

    NASA Technical Reports Server (NTRS)

    Keddy, Christopher P.; Haas, Jon P.; Starritt, Larry

    2008-01-01

    Self Contained Oxygen Generators (SCOGs) have widespread use in providing emergency breathing oxygen in a variety of environments including mines, submarines, spacecraft, and aircraft. These devices have definite advantages over storing of gaseous or liquid oxygen. The oxygen is not generated until a chemical briquette containing a chlorate or perchlorate oxidizer and a solid metallic fuel such as iron is ignited starting a thermal decomposition process allowing gaseous oxygen to be produced. These devices are typically very safe to store, easy to operate, and have primarily only a thermal hazard to the operator that can be controlled by barriers or furnaces. Tens of thousands of these devices are operated worldwide every year without major incident. This report examines the rare case of a SCOG whose behavior was both abnormal and lethal. This particular type of SCOG reviewed is nearly identical to a flight qualified version of SCOG slated for use on manned space vehicles. This Investigative Report is a compilation of a NASA effort in conjunction with other interested parties including military and aerospace to understand the causes of the particular SCOG accident and what preventative measures can be taken to ensure this incident is not repeated. This report details the incident and examines the root causes of the observed SCOG behavior from forensic evidence. A summary of chemical and numerical analysis is provided as a background to physical testing of identical SCOG devices. The results and findings of both small scale and full scale testing are documented on a test-by-test basis along with observations and summaries. Finally, conclusions are presented on the findings of this investigation, analysis, and testing along with suggestions on preventative measures for any entity interested in the safe use of these devices.

  12. Effective hydrogen generator testing for on-site small engine

    NASA Astrophysics Data System (ADS)

    Chaiwongsa, Praitoon; Pornsuwancharoen, Nithiroth; Yupapin, Preecha P.

    2009-07-01

    We propose a new concept of hydrogen generator testing for on-site small engine. In general, there is a trade-off between simpler vehicle design and infrastructure issues, for instance, liquid fuels such as gasoline and methanol for small engine use. In this article we compare the hydrogen gases combination the gasoline between normal systems (gasoline only) for small engine. The advantage of the hydrogen combines gasoline for small engine saving the gasoline 25%. Furthermore, the new concept of hydrogen combination for diesel engine, bio-diesel engine, liquid petroleum gas (LPG), natural gas vehicle (NGV), which is discussed in details.

  13. Quantum Statistical Testing of a Quantum Random Number Generator

    SciTech Connect

    Humble, Travis S

    2014-01-01

    The unobservable elements in a quantum technology, e.g., the quantum state, complicate system verification against promised behavior. Using model-based system engineering, we present methods for verifying the opera- tion of a prototypical quantum random number generator. We begin with the algorithmic design of the QRNG followed by the synthesis of its physical design requirements. We next discuss how quantum statistical testing can be used to verify device behavior as well as detect device bias. We conclude by highlighting how system design and verification methods must influence effort to certify future quantum technologies.

  14. International Space Station United States Oxygen Generator Development Testing

    NASA Technical Reports Server (NTRS)

    Erickson, Robert J.; Mason, Richard K.

    2000-01-01

    A life test of a liquid anode feed oxygen generator assembly (OGA) using SPE(R) (United Technologies Corporation, Hamilton Sundstrand Division) membrane technology was terminated in June of 1999. In the total 15,658 hours of operation at MSFC since delivery in 1995, the OGA has produced 2,103 kilograms (kg) (4,632 pounds mass (lbm)) of oxygen, and 263 kg (579 lbm) of hydrogen. Evaluation of cell stack characteristics and oxygen and hydrogen hydrophilic/hydrophobic membrane separators will be discussed.

  15. End-on radioisotope thermoelectric generator impact tests

    NASA Astrophysics Data System (ADS)

    Reimus, M. A. H.; Hinckley, J. E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of 238Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure.

  16. End-on radioisotope thermoelectric generator impact tests

    SciTech Connect

    Reimus, M.A.; Hinckley, J.E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure. {copyright} {ital 1997 American Institute of Physics.}

  17. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M. A. H.; Hinckley, J. E.

    1998-01-15

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel.

  18. Radioisotope thermoelectric generator/thin fragment impact test

    NASA Astrophysics Data System (ADS)

    Reimus, M. A. H.; Hinckley, J. E.

    1998-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of 238Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel.

  19. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M.A.; Hinckley, J.E.

    1998-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel. {copyright} {ital 1998 American Institute of Physics.}

  20. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M.A.H.; Hinckley, J.E.

    1998-12-31

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the convertor housing, failure of one fueled clad, and release of a small quantity of fuel.

  1. End-on radioisotope thermoelectric generator impact tests

    SciTech Connect

    Reimus, M.A.H.; Hhinckley, J.E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of [sup 238]Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure.

  2. Processing and Prolonged 500 C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect

    NASA Technical Reports Server (NTRS)

    Spry, David J.; Neudeck, Philip G.; Chen, Liangyu; Lukco, Dorothy; Chang, Carl W.; Beheim, Glenn M.; Krasowski, Michael J.; Prokop, Norman F.

    2015-01-01

    Complex integrated circuit (IC) chips rely on more than one level of interconnect metallization for routing of electrical power and signals. This work reports the processing and testing of 4H-SiC junction field effect transistor (JFET) prototype ICs with two levels of metal interconnect capable of prolonged operation at 500 C. Packaged functional circuits including 3-and 11-stage ring oscillators, a 4-bit digital to analog converter, and a 4-bit address decoder and random access memory cell have been demonstrated at 500 C. A 3-stage oscillator functioned for over 3000 hours at 500 C in air ambient.

  3. Processing and Prolonged 500 C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect

    NASA Technical Reports Server (NTRS)

    Spry, David J.; Neudeck, Philip G.; Chen, Liangyu; Lukco, Dorothy; Chang, Carl W.; Beheim, Glenn M.; Krasowski, Michael J.; Prokop, Norman F.

    2015-01-01

    Complex integrated circuit (IC) chips rely on more than one level of interconnect metallization for routing of electrical power and signals. This work reports the processing and testing of 4H-SiC junction field effect transistor (JFET) prototype IC's with two levels of metal interconnect capable of prolonged operation at 500 C. Packaged functional circuits including 3- and 11-stage ring oscillators, a 4-bit digital to analog converter, and a 4-bit address decoder and random access memory cell have been demonstrated at 500 C. A 3-stage oscillator functioned for over 3000 hours at 500 C in air ambient. Improved reproducibility remains to be accomplished.

  4. Thermal vacuum life test facility for radioisotope thermoelectric generators

    SciTech Connect

    Deaton, R.L.; Goebel, C.J.; Amos, W.R.

    1990-01-01

    In the late 1970's, the Department of Energy (DOE) assigned Monsanto Research Corporation, Mound Facility, now operated by EG G Mound Applied Technologies, the responsibility for assembling and testing General Purpose Heat Source (GPHS) radioisotope thermoelectric generators (RTGs). Assembled and tested were five RTGs, which included four flight units and one non-flight qualification unit. Figure 1 shows the RTG, which was designed by General Electric AstroSpace Division (GE/ASD) to produce 285 W of electrical power. A detailed description of the processes for RTG assembly and testing is presented by Amos and Goebel (1989). The RTG performance data are described by Bennett, et al. (1986). The flight units will provide electrical power for the National Aeronautics and Space Administration's (NASA) Galileo mission to Jupiter (two RTGs) and the joint NASA/European Space Agency (ESA) Ulysses mission to study the polar regions of the sun (one RTG). The remaining flight unit will serve as the spare for both missions, and a non-flight qualification unit was assembled and tested to ensure that performance criteria were adequately met. 4 refs., 3 figs.

  5. Thermal vacuum life test facility for radioisotope thermoelectric generators

    NASA Astrophysics Data System (ADS)

    Deaton, R. L.; Goebel, C. J.; Amos, W. R.

    In the late 1970's, the Department of Energy (DOE) assigned Monsanto Research Corporation, Mound Facility, now operated by EG and G Mound Applied Technologies, the responsibility for assembling and testing General Purpose Heat Source (GPHS) radioisotope thermoelectric generators (RTGs). Assembled and tested were five RTGs, which included four flight units and one non-flight qualification unit. Figure 1 shows the RTG, which was designed by General Electric AstroSpace Division (GE/ASD) to produce 285 W of electrical power. A detailed description of the processes for RTG assembly and testing is presented by Amos and Goebel (1989). The RTG performance data are described by Bennett, et al., (1986). The flight units will provide electrical power for the National Aeronautics and Space Administration's (NASA) Galileo mission to Jupiter (two RTGs) and the joint NASA/European Space Agency (ESA) Ulysses mission to study the polar regions of the sun (one RTG). The remaining flight unit will serve as the spare for both missions, and a non-flight qualification unit was assembled and tested to ensure that performance criteria were adequately met.

  6. Rupture testing for the quality control of electrodeposited copper interconnections in high-speed, high-density circuits

    NASA Technical Reports Server (NTRS)

    Zakraysek, Louis

    1987-01-01

    Printed Wiring Multilayer Board (PWMLB) structures for high speed, high density circuits are prone to failure due to the microcracking of electrolytic copper interconnections. The failure can occur in the foil that makes up the inner layer traces or in the plated through holes (PTH) deposit that forms the layer to layer interconnections. It is shown that there are some distinctive differences in the quality of Type E copper and that these differences can be detected before its use in a PWMLB. It is suggested that the strength of some Type E copper can be very low when the material is hot and that it is the use of this poor quality material in a PWMLB that results in PTH and inner layer microcracking. Since the PWMLB failure in question are induced by a thermal stress, and since the poorer grades of Type E materials used in these structures are susceptible to premature failure under thermal stress, the use of elevated temperature rupture and creep rupture testing is proposed as a means for screening copper foil, or its PTH equivalent, in order to eliminate the problem of Type E copper microcracking in advanced PWMLBs.

  7. Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 2: Tests with the closed circuit

    NASA Technical Reports Server (NTRS)

    Barna, P. Stephen

    1991-01-01

    This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period June - August 1991. Throughout the testing the tunnel was operated in the 'closed circuit mode,' that is when the airflow was set up by an axial flow fan, which was located inside the tunnel circuit and was directly driven by a motor. The tests were first performed with the closed test section and were subsequently repeated with the open test section, the latter operating with the nozzle-diffuser at its optimum setting. On this subject, reference is made to the report (1) issued January 1991, under contract 17-GFY900125, which summarizes the result obtained with the tunnel operating in the 'open circuit mode.' The tests confirmed the viability of the tunnel design, and the flow distributions in most of the tunnel components were considered acceptable. There were found, however, some locations where the flow distribution requires improvement. This applies to the flow upstream of the fan where the flow was found skewed, thus affecting the flow downstream. As a result of this, the flow appeared separated at the end of the large diffuser at the outer side. All tests were performed at NASA LaRC.

  8. Advanced E-O test capability for Army Next-Generation Automated Test System (NGATS)

    NASA Astrophysics Data System (ADS)

    Errea, S.; Grigor, J.; King, D. F.; Matis, G.; McHugh, S.; McKechnie, J.; Nehring, B.

    2015-05-01

    The Future E-O (FEO) program was established to develop a flexible, modular, automated test capability as part of the Next Generation Automatic Test System (NGATS) program to support the test and diagnostic needs of currently fielded U.S. Army electro-optical (E-O) devices, as well as being expandable to address the requirements of future Navy, Marine Corps and Air Force E-O systems. Santa Barbara infrared (SBIR) has designed, fabricated, and delivered three (3) prototype FEO for engineering and logistics evaluation prior to anticipated full-scale production beginning in 2016. In addition to presenting a detailed overview of the FEO system hardware design, features and testing capabilities, the integration of SBIR's EO-IR sensor and laser test software package, IRWindows 4™, into FEO to automate the test execution, data collection and analysis, archiving and reporting of results is also described.

  9. Single Stage Contactor Testing Of The Next Generation Solvent Blend

    SciTech Connect

    Herman, D. T.; Peters, T. B.; Duignan, M. R.; Williams, M. R.; Poirier, M. R.; Brass, E. A.; Garrison, A. G.; Ketusky, E. T.

    2014-01-06

    The Modular Caustic Side Solvent Extraction (CSSX) Unit (MCU) facility at the Savannah River Site (SRS) is actively pursuing the transition from the current BOBCalixC6 based solvent to the Next Generation Solvent (NGS)-MCU solvent to increase the cesium decontamination factor. To support this integration of NGS into the MCU facility the Savannah River National Laboratory (SRNL) performed testing of a blend of the NGS (MaxCalix based solvent) with the current solvent (BOBCalixC6 based solvent) for the removal of cesium (Cs) from the liquid salt waste stream. This testing utilized a blend of BOBCalixC6 based solvent and the NGS with the new extractant, MaxCalix, as well as a new suppressor, tris(3,7dimethyloctyl) guanidine. Single stage tests were conducted using the full size V-05 and V-10 liquid-to-liquid centrifugal contactors installed at SRNL. These tests were designed to determine the mass transfer and hydraulic characteristics with the NGS solvent blended with the projected heel of the BOBCalixC6 based solvent that will exist in MCU at time of transition. The test program evaluated the amount of organic carryover and the droplet size of the organic carryover phases using several analytical methods. The results indicate that hydraulically, the NGS solvent performed hydraulically similar to the current solvent which was expected. For the organic carryover 93% of the solvent is predicted to be recovered from the stripping operation and 96% from the extraction operation. As for the mass transfer, the NGS solvent significantly improved the cesium DF by at least an order of magnitude when extrapolating the One-stage results to actual Seven-stage extraction operation with a stage efficiency of 95%.

  10. Polymorphic Electronic Circuits

    NASA Technical Reports Server (NTRS)

    Stoica, Adrian

    2004-01-01

    Polymorphic electronics is a nascent technological discipline that involves, among other things, designing the same circuit to perform different analog and/or digital functions under different conditions. For example, a circuit can be designed to function as an OR gate or an AND gate, depending on the temperature (see figure). Polymorphic electronics can also be considered a subset of polytronics, which is a broader technological discipline in which optical and possibly other information- processing systems could also be designed to perform multiple functions. Polytronics is an outgrowth of evolvable hardware (EHW). The basic concepts and some specific implementations of EHW were described in a number of previous NASA Tech Briefs articles. To recapitulate: The essence of EHW is to design, construct, and test a sequence of populations of circuits that function as incrementally better solutions of a given design problem through the selective, repetitive connection and/or disconnection of capacitors, transistors, amplifiers, inverters, and/or other circuit building blocks. The evolution is guided by a search-and-optimization algorithm (in particular, a genetic algorithm) that operates in the space of possible circuits to find a circuit that exhibits an acceptably close approximation of the desired functionality. The evolved circuits can be tested by computational simulation (in which case the evolution is said to be extrinsic), tested in real hardware (in which case the evolution is said to be intrinsic), or tested in random sequences of computational simulation and real hardware (in which case the evolution is said to be mixtrinsic).

  11. Testing the Generation of Jets in Young Stars with ALMA

    NASA Astrophysics Data System (ADS)

    Bacciotti, F.; Podio, L.; Codella, C.; Coffey, D.

    2015-12-01

    Jets are a crucial element in the star formation process, as they are thought to remove the excess angular momentum from the system. A firm detection of jet rotation could lend support to this statement. Jet rotation studies, however, are hindered by the requirement of simultaneous high spatial and spectral resolution, and as a matter of fact, the rotation interpretation is still debated. Soon, however, the improved spatial resolution of ALMA will allow us to firmly establish rotation patterns. At the same time the new ALMA polarimetric capabilities will permit the determination of the magnetic configuration in the system. The ALMA combined search for rotation properties and magnetic fields will be a powerful test of the proposed jet generation mechanisms.

  12. TESTING OF THE SECOND GENERATION SPINTEK ROTARY FILTER -11357

    SciTech Connect

    Herman, D.; Poirier, M.; Fowley, M.; Keefer, M.; Huff, T.

    2011-02-02

    The SpinTek rotary microfilter has been developed under the Department of Energy (DOE) Office of Environmental Management (EM) for the purpose of deployment in radioactive service in the DOE complex. The unit that was fabricated and tested is the second generation of the filter that incorporates recommended improvements from previous testing. The completion of this test satisfied a key milestone for the EM technology development program and technology readiness for deployment by Savannah River Remediation in the Small Column Ion Exchange and Sludge Washing processes at the Savannah River Site (SRS). The Savannah River National Laboratory (SRNL) contracted SpinTek Filtration to fabricate a full scale 25 disk rotary filter and perform a 1000 hour endurance test with a simulated SRS sludge. Over 1500 hours of operation have been completed with the filter. SpinTek Filtration fabricated a prototypic 25 disk rotary filter including updates to manufacturing tolerances, an updated design to the rotary joint, improved cooling to the bottom journal, decreases in disk and filter shaft hydraulic resistances. The filter disks were fabricated with 0.5 {micro} pore size, sintered-metal filter media manufactured by Pall Corporation (M050). After fabrication was complete, the filter passed acceptance tests demonstrating rejection of solids and clean water flux with a 50% improvement over the previous filters. Once the acceptance test was complete, a 1000 hour endurance test was initiated simulating a sludge washing process. The test used a simulated SRS Sludge Batch 6 recipe. The insoluble solids started at 5 wt% and were raised to 10 and 15 wt% insoluble solids to simulate the concentration of a large volume tank. The filter system was automated and set up for 24 hour unattended operation. To facilitate this, process control logic was written to operate the filter. During the development it was demonstrated that the method of starting and stopping the filter can affect the build

  13. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  14. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  15. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  16. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  17. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  18. Multiloop integral system test (MIST): Test Group 34, Steam generator tube rupture

    SciTech Connect

    Gloudemans, J.R. . Nuclear Power Div.)

    1989-07-01

    The multiloop integral system test (MIST) is part of a multiphase program started in 1983 to address small-break loss-of-coolant accidents (SBLOCAs) specific to Babcock and Wilcox designed plants. MIST is sponsored by the US Nuclear Regulatory Commission, the Babcock Wilcox Owners Group, the Electric Power Research Institute, and Babcock and Wilcox. The unique features of the Babcock and Wilcox design, specifically the hot leg U-bends and steam generators, prevented the use of existing integral system data or existing integral facilities to address the thermal-hydraulic SBLOCA questions. MIST and two other supporting facilities were specifically designed and constructed for this program, and an existing facility--the Once Through Integral System (OTIS)--was also used. Data from MIST and the other facilities will be used to benchmark the adequacy of system codes, such as RELAP5 and TRAC, for predicting abnormal plant transients. The MIST program is reported in 11 volumes. The program is summarized in Volume 1; Volumes 2 through 8 describes groups of tests by test type; Volume 9 presents inter-group comparisons; Volume 10 provides comparisons between the calculations of RELAP5/MOD2 and MIST observations, and Volume 11 presents the later Phase 4 tests. This Volume 6 pertains to Test Group 34, Steam Generator Tube Rupture. The specifications, conduct, observations, and results of these tests are described. 6 refs., 189 figs., 16 tabs.

  19. Tone signal generator for producing multioperator tone signals using an operator circuit including a waveform generator, a selector and an enveloper

    DOEpatents

    Dong, Q.; Jenkins, M.V.; Bernadas, S.R.

    1997-09-09

    A frequency modulation (FM) tone signal generator for generating a FM tone signal is disclosed. The tone signal generator includes a waveform generator having a plurality of wave tables, a selector and an enveloper. The waveform generator furnishes a waveform signal in response to a phase angle address signal. Each wave table stores a different waveform. The selector selects one of the wave tables in response to a plurality of selection signals such that the selected wave table largely provides the waveform signal upon being addressed largely by the phase angle address signal. Selection of the selected wave table varies with each selection signal. The enveloper impresses an envelope signal on the waveform signal. The envelope signal is used as a carrier or modulator for generating the FM tone signal. 17 figs.

  20. Tone signal generator for producing multioperator tone signals using an operator circuit including a waveform generator, a selector and an enveloper

    DOEpatents

    Dong, Qiujie; Jenkins, Michael V.; Bernadas, Salvador R.

    1997-01-01

    A frequency modulation (FM) tone signal generator for generating a FM tone signal is disclosed. The tone signal generator includes a waveform generator having a plurality of wave tables, a selector and an enveloper. The waveform generator furnishes a waveform signal in response to a phase angle address signal. Each wave table stores a different waveform. The selector selects one of the wave tables in response to a plurality of selection signals such that the selected wave table largely provides the waveform signal upon being addressed largely by the phase angle address signal. Selection of the selected wave table varies with each selection signal. The enveloper impresses an envelope signal on the waveform signal. The envelope signal is used as a carrier or modulator for generating the FM tone signal.

  1. Concept For Generation Of Long Pseudorandom Sequences

    NASA Technical Reports Server (NTRS)

    Wang, C. C.

    1990-01-01

    Conceptual very-large-scale integrated (VLSI) digital circuit performs exponentiation in finite field. Algorithm that generates unusually long sequences of pseudorandom numbers executed by digital processor that includes such circuits. Concepts particularly advantageous for such applications as spread-spectrum communications, cryptography, and generation of ranging codes, synthetic noise, and test data, where usually desirable to make pseudorandom sequences as long as possible.

  2. Measures for ensuring reliable operation of the welded joint connecting the reactor coolant circuit's header to the shell of a steam generator used at a VVER-1000 reactor-based nuclear power station

    NASA Astrophysics Data System (ADS)

    Kharchenko, S. A.; Trunov, N. B.; Korotaev, N. F.; Lyakishev, S. L.

    2011-03-01

    Problems that arose around the weld joint connecting the reactor coolant circuit's header to the steam generator shell during operation of steam generators at nuclear power stations equipped with VVER-1000 reactors are considered. Works on studying the defects occurred in the header's metal are described, and ways for preventing their development are determined.

  3. Nanosecond pulsed electric fields (nsPEFs) low cost generator design using power MOSFET and Cockcroft-Walton multiplier circuit as high voltage DC source

    NASA Astrophysics Data System (ADS)

    Sulaeman, M. Y.; Widita, R.

    2014-09-01

    Purpose: Non-ionizing radiation therapy for cancer using pulsed electric field with high intensity field has become an interesting field new research topic. A new method using nanosecond pulsed electric fields (nsPEFs) offers a novel means to treat cancer. Not like the conventional electroporation, nsPEFs able to create nanopores in all membranes of the cell, including membrane in cell organelles, like mitochondria and nucleus. NsPEFs will promote cell death in several cell types, including cancer cell by apoptosis mechanism. NsPEFs will use pulse with intensity of electric field higher than conventional electroporation, between 20-100 kV/cm and with shorter duration of pulse than conventional electroporation. NsPEFs requires a generator to produce high voltage pulse and to achieve high intensity electric field with proper pulse width. However, manufacturing cost for creating generator that generates a high voltage with short duration for nsPEFs purposes is highly expensive. Hence, the aim of this research is to obtain the low cost generator design that is able to produce a high voltage pulse with nanosecond width and will be used for nsPEFs purposes. Method: Cockcroft-Walton multiplier circuit will boost the input of 220 volt AC into high voltage DC around 1500 volt and it will be combined by a series of power MOSFET as a fast switch to obtain a high voltage with nanosecond pulse width. The motivation using Cockcroft-Walton multiplier is to acquire a low-cost high voltage DC generator; it will use capacitors and diodes arranged like a step. Power MOSFET connected in series is used as voltage divider to share the high voltage in order not to damage them. Results: This design is expected to acquire a low-cost generator that can achieve the high voltage pulse in amount of -1.5 kV with falltime 3 ns and risetime 15 ns into a 50Ω load that will be used for nsPEFs purposes. Further detailed on the circuit design will be explained at presentation.

  4. Nanosecond pulsed electric fields (nsPEFs) low cost generator design using power MOSFET and Cockcroft-Walton multiplier circuit as high voltage DC source

    SciTech Connect

    Sulaeman, M. Y.; Widita, R.

    2014-09-30

    Purpose: Non-ionizing radiation therapy for cancer using pulsed electric field with high intensity field has become an interesting field new research topic. A new method using nanosecond pulsed electric fields (nsPEFs) offers a novel means to treat cancer. Not like the conventional electroporation, nsPEFs able to create nanopores in all membranes of the cell, including membrane in cell organelles, like mitochondria and nucleus. NsPEFs will promote cell death in several cell types, including cancer cell by apoptosis mechanism. NsPEFs will use pulse with intensity of electric field higher than conventional electroporation, between 20–100 kV/cm and with shorter duration of pulse than conventional electroporation. NsPEFs requires a generator to produce high voltage pulse and to achieve high intensity electric field with proper pulse width. However, manufacturing cost for creating generator that generates a high voltage with short duration for nsPEFs purposes is highly expensive. Hence, the aim of this research is to obtain the low cost generator design that is able to produce a high voltage pulse with nanosecond width and will be used for nsPEFs purposes. Method: Cockcroft-Walton multiplier circuit will boost the input of 220 volt AC into high voltage DC around 1500 volt and it will be combined by a series of power MOSFET as a fast switch to obtain a high voltage with nanosecond pulse width. The motivation using Cockcroft-Walton multiplier is to acquire a low-cost high voltage DC generator; it will use capacitors and diodes arranged like a step. Power MOSFET connected in series is used as voltage divider to share the high voltage in order not to damage them. Results: This design is expected to acquire a low-cost generator that can achieve the high voltage pulse in amount of −1.5 kV with falltime 3 ns and risetime 15 ns into a 50Ω load that will be used for nsPEFs purposes. Further detailed on the circuit design will be explained at presentation.

  5. A Parallel Genetic Algorithm for Automated Electronic Circuit Design

    NASA Technical Reports Server (NTRS)

    Lohn, Jason D.; Colombano, Silvano P.; Haith, Gary L.; Stassinopoulos, Dimitris; Norvig, Peter (Technical Monitor)

    2000-01-01

    We describe a parallel genetic algorithm (GA) that automatically generates circuit designs using evolutionary search. A circuit-construction programming language is introduced and we show how evolution can generate practical analog circuit designs. Our system allows circuit size (number of devices), circuit topology, and device values to be evolved. We present experimental results as applied to analog filter and amplifier design tasks.

  6. Large Volume Coagulation Utilizing Multiple Cavitation Clouds Generated by Array Transducer Driven by 32 Channel Drive Circuits

    NASA Astrophysics Data System (ADS)

    Nakamura, Kotaro; Asai, Ayumu; Sasaki, Hiroshi; Yoshizawa, Shin; Umemura, Shin-ichiro

    2013-07-01

    High-intensity focused ultrasound (HIFU) treatment is a noninvasive treatment, in which focused ultrasound is generated outside the body and coagulates a diseased tissue. The advantage of this method is minimal physical and mental stress to the patient, and the disadvantage is the long treatment time caused by the smallness of the therapeutic volume by a single exposure. To improve the efficiency and shorten the treatment time, we are focusing attention on utilizing cavitation bubbles. The generated microbubbles can convert the acoustic energy into heat with a high efficiency. In this study, using the class D amplifiers, which we have developed, to drive the array transducer, we demonstrate a new method to coagulate a large volume by a single HIFU exposure through generating cavitation bubbles distributing in a large volume and vibrating all of them. As a result, the coagulated volume by the proposed method was 1.71 times as large as that of the conventional method.

  7. Plasma density estimation of a fusion grade ICP source through electrical parameters of the RF generator circuit

    NASA Astrophysics Data System (ADS)

    Bandyopadhyay, M.; Sudhir, Dass; Chakraborty, A.

    2015-03-01

    An inductively coupled plasma (ICP) based negative hydrogen ion source is chosen for ITER neutral beam (NB) systems. To avoid regular maintenance in a radioactive environment with high flux of 14 MeV neutrons and gamma rays, invasive plasma diagnostics like probes are not included in the ITER NB source design. While, optical or microwave based diagnostics which are normally used in other plasma sources, are to be avoided in the case of ITER sources due to the overall system design and interface issues. In such situation, alternative forms of assessment to characterize ion source plasma become a necessity. In the present situation, the beam current through the extraction system in the ion source is the only measurement which indicates plasma condition inside the ion source. However, beam current not only depends on the plasma condition near the extraction region but also on the perveance condition and negative ion stripping. Apart from that, the ICP production region radio frequency (RF) driver region) is placed far (∼30 cm) from the extraction region. Therefore, there are uncertainties involved in linking the beam current with plasma properties inside the RF driver. To maintain the optimum condition for source operation it is necessary to maintain the optimum conditions in the driver. A method of characterization of the plasma density in the driver without using any invasive or non-invasive probes could be a useful tool to achieve that objective. Such a method, which is exclusively for ICP based ion sources, is presented in this paper. In this technique, plasma density inside the RF driver is estimated through the measurements of the electrical parameters in the RF power supply circuit path. Monitoring RF driver plasma through the described route will be useful during the source commissioning phase and also in the beam operation phase.

  8. Comparison of photonic integrated circuits for millimeter-wave signal generation between dual-wavelength sources for optical heterodyning and pulsed mode-locked lasers

    NASA Astrophysics Data System (ADS)

    Carpintero, Guillermo; Gordon, Carlos; Guzman, Robinson; Leijtens, Xaveer; Van Dijk, Frédéric; Kervella, Gaël.; Fice, Martyn J.; Balakier, Katarzyna; Renaud, Cyril C.

    2015-03-01

    A comparative study of two different Photonic Integrated Circuits (PICs) structures for continuous-wave generation of millimeter-wave (MMW) signals is presented, each using a different approach. One approach is optical heterodyning, using an integrated dual-wavelength laser source based on Arrayed Waveguide Grating. The other is based on ModeLocked Laser Diodes (MLLDs). A novel building block -Multimode Interference Reflectors (MIRs) - is used to integrate on-chip both structures, without need of cleaved facets to define the laser cavity. This fact enables us to locate any of these structures at any location within the photonic chip. As will be shown, the MLLD structure provides a simple source for low frequencies. Higher frequencies are easier to achieve by optical heterodyne. Both types of structures have been fabricated on a generic foundry in a commercial MPW PIC technology.

  9. GENERIC VERIFICATION PROTOCOL: DISTRIBUTED GENERATION AND COMBINED HEAT AND POWER FIELD TESTING PROTOCOL

    EPA Science Inventory

    This report is a generic verification protocol by which EPA’s Environmental Technology Verification program tests newly developed equipment for distributed generation of electric power, usually micro-turbine generators and internal combustion engine generators. The protocol will ...

  10. An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

    NASA Astrophysics Data System (ADS)

    Hudec, Ján; Gramatová, Elena

    2015-07-01

    The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are generated over an instruction set architecture and a processor description. Such functional tests belong to the software-oriented testing. Quality of the tests is evaluated by code coverage of the processor description using simulation. The presented test generation method uses VHDL models of processors and the professional simulator ModelSim. The rules, parameters and fitness functions were defined for various genetic algorithms used in automatic test generation. Functionality and effectiveness were evaluated using the RISC type processor DP32.

  11. Enhancing Students' Learning Process Through Self-Generated Tests

    NASA Astrophysics Data System (ADS)

    Sanchez-Elez, Marcos; Pardines, Inmaculada; Garcia, Pablo; Miñana, Guadalupe; Roman, Sara; Sanchez, Margarita; Risco, Jose Luis

    2013-03-01

    The use of new technologies in higher education has surprisingly emphasized students' tendency to adopt a passive behavior in class. Participation and interaction of students are essential to improve academic results. This paper describes an educational experiment aimed at the promotion of students' autonomous learning by requiring them to generate test type questions related to the contents of the course. The main idea is to make the student feel part of the evaluation process by including students' questions in the evaluation exams. A set of applications running on our university online learning environment has been developed in order to provide both students and teachers with the necessary tools for a good interaction between them. Questions uploaded by students are visible to every enrolled student as well as to each involved teacher. In this way, we enhance critical analysis skills, by solving and finding possible mistakes in the questions sent by their fellows. The experiment was applied over 769 students from 12 different courses. Results show that the students who have actively participated in the experiment have obtained better academic performance.

  12. A products generator for testing the performance of disassembly procedures

    NASA Astrophysics Data System (ADS)

    Adenso-Díaz, Belarmino; González Torre, Beatriz

    2004-12-01

    In recent decades, regulations and markets have been exerting pressure on designers and manufacturers to take more responsibility for the environmental impacts of their products throughout their life cycles. The problem of finding the disassembly sequence represents one of the major challenges when attempting to close product life cycles by carrying out reuse, recycling and remanufacturing practices. Many different techniques have been used to deal with this problem, varying from exact to heuristic solutions. So far, however, not much effort has gone into measuring and comparing the efficiency of this wide set of techniques. This is partly due to the difficulties of getting a wide population of real products, belonging to different industries and with different degree of complexity that might constitute a representative population for carrying out this kind of task. In this paper, a generator of complex products is presented that is able to build up products with hundreds of components joined by different kinds of joints in such a way that a theoretical "good" disassembly sequence is always known. The efficiency of different methods for general products can thus be easily compared. The performance of a Scatter Search algorithm is tested as an example of its application in this case.

  13. Mechanical testing and macro-mechanical finite element simulation of the deformation, fracture, and short circuit initiation of cylindrical Lithium ion battery cells

    NASA Astrophysics Data System (ADS)

    Greve, Lars; Fehrenbach, Clemens

    2012-09-01

    A quasi-static mechanical abuse test program on cylindrical Lithium ion battery cells has been performed at a state of charge (SoC) of 0%. The investigated load cases involved radial crushing, local lateral indentation and global three-point bending of the cell. During the tests, the punch load, the punch displacement, the cell voltage and the temperature development of the cell have been monitored using an infrared camera and temperature sensors. After the test, the cells have been analysed using computer tomography. It is indicated that macroscopic jelly roll fracture on a global scale initiates the internal short circuits, revealed by a sudden decrease of the global mechanical load due to the rupture, followed by a drop of the measured voltage and immediate increase in cell temperature. A macro-mechanical finite element crash simulation model has been established for the cell housing and the jelly roll. The classical stress-based criterion after Mohr and Coulomb (MC) has been applied to predict fracture and the initiation of an internal short circuit of the jelly roll. The MC criterion correctly represents the punch displacement to fracture, where the predicted fracture locations correspond to the observed locations of the internal short circuits of the cells.

  14. Multi-channel detector readout method and integrated circuit

    DOEpatents

    Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

    2004-05-18

    An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

  15. Multi-channel detector readout method and integrated circuit

    DOEpatents

    Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

    2006-12-12

    An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

  16. Quantum Noise in Large-Scale Coherent Nonlinear Photonic Circuits

    NASA Astrophysics Data System (ADS)

    Santori, Charles; Pelc, Jason S.; Beausoleil, Raymond G.; Tezak, Nikolas; Hamerly, Ryan; Mabuchi, Hideo

    2014-06-01

    A semiclassical simulation approach is presented for studying quantum noise in large-scale photonic circuits incorporating an ideal Kerr nonlinearity. A circuit solver is used to generate matrices defining a set of stochastic differential equations, in which the resonator field variables represent random samplings of the Wigner quasiprobability distributions. Although the semiclassical approach involves making a large-photon-number approximation, tests on one- and two-resonator circuits indicate satisfactory agreement between the semiclassical and full-quantum simulation results in the parameter regime of interest. The semiclassical model is used to simulate random errors in a large-scale circuit that contains 88 resonators and hundreds of components in total and functions as a four-bit ripple counter. The error rate as a function of on-state photon number is examined, and it is observed that the quantum fluctuation amplitudes do not increase as signals propagate through the circuit, an important property for scalability.

  17. Aerodynamic flow quality and acoustic characteristics of the 40- by 80-foot test section circuit of the National Full-Scale Aerodynamic Complex

    NASA Technical Reports Server (NTRS)

    Olson, Lawrence E.; Zell, Peter T.; Soderman, Paul T.; Falarski, Michael D.; Corsiglia, Victor R.; Edenborough, H. Kipling

    1988-01-01

    The 40- by 80-foot wind tunnel circuit of the National Full-Scale Aerodynamic Complex (NFAC) has recently undergone major modifications and subsequently completed final acceptance testing. The initial testing and calibration of the wind tunnel are described and in many cases these results are compared with predictions derived from model tests and theoretical analyses. The wind tunnel meets or exceeds essentially all performance objectives. The facility runs smoothly and routinely at its maximum test-section velocity of 300 knots (Mach number = 0.45). An effective cooling air exchange system enables the wind tunnel to operate indefinitely at this maximum power condition. Throughout the operating envelope of the wind tunnel the test-section dynamic pressure is uniform to within + or - 0.5 deg, and the axial component of turbulence is generally less than 0.5 percent. Acoustic measurements indicate that, due to the low noise fans and acoustic treatment in the wind-tunnel circuit and test section, the background noise level in the test section is comparable to other large-scale acoustic wind tunnels in the United States and abroad.

  18. MULTIPLIER CIRCUIT

    DOEpatents

    Thomas, R.E.

    1959-01-20

    An electronic circuit is presented for automatically computing the product of two selected variables by multiplying the voltage pulses proportional to the variables. The multiplier circuit has a plurality of parallel resistors of predetermined values connected through separate gate circults between a first input and the output terminal. One voltage pulse is applied to thc flrst input while the second voltage pulse is applied to control circuitry for the respective gate circuits. Thc magnitude of the second voltage pulse selects the resistors upon which the first voltage pulse is imprcssed, whereby the resultant output voltage is proportional to the product of the input voltage pulses

  19. GATING CIRCUITS

    DOEpatents

    Merrill, L.C.

    1958-10-14

    Control circuits for vacuum tubes are described, and a binary counter having an improved trigger circuit is reported. The salient feature of the binary counter is the application of the input signal to the cathode of each of two vacuum tubes through separate capacitors and the connection of each cathode to ground through separate diodes. The control of the binary counter is achieved in this manner without special pulse shaping of the input signal. A further advantage of the circuit is the simplicity and minimum nuruber of components required, making its use particularly desirable in computer machines.

  20. A Step Response Based Mixed-Signal BIST Approach for Continuous-time Linear Circuits

    NASA Technical Reports Server (NTRS)

    Walker, Alvernon; Lala, P. K.

    2001-01-01

    A new Mixed-Signal Built-in self-test approach that is based upon the step response of a reconfigurable (or multifunction) analog block is presented in this paper. The technique requires the overlapping step response of the Circuit Under Test (CUT) for two circuit configurations. Each configuration can be realized by changing the topology of the CUT or by sampling two CUT nodes with differing step responses. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) and/or digital-to-analog converter(DAC). It also does not require any precision voltage sources or comparators. This approach does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with the application of the proposed approach to a circuit found in the work of Epstein et al and two ITC 97 analog benchmark circuits.

  1. A universal programmable driving circuit for spatial light modulators

    NASA Astrophysics Data System (ADS)

    Lan, Wu; Ningmei, Yu; Yaohui, Zhang; Wenlong, Ma

    2009-07-01

    A universal programmable multi-quantum-well (MQW) spatial light modulator (SLM) driving circuit is developed. With a twice scanning, it can generate programmable signals to drive a non-linear MQW SLM by using a software preprocessing unit. By adjusting the switching network of the driving circuit, this circuit can reduce the switching noise and improve the output precision. The chip test results show that the driving voltage can swing from 0 to VDD, and its resolution could be close to 256 with a pixel area of only 65 × 65 μm2.

  2. Toward next-generation optical networks: a network operator perspective based on experimental tests and economic analysis

    NASA Astrophysics Data System (ADS)

    Xiao, Xiaojun; Du, Chunsheng; Zhou, Rongsheng

    2004-04-01

    As a result of data traffic"s exponential growth, network is currently evolving from fixed circuit switched services to dynamic packet switched services, which has brought unprecedented changes to the existing transport infrastructure. It is generally agreed that automatic switched optical network (ASON) is one of the promising solutions for the next generation optical networks. In this paper, we present the results of our experimental tests and economic analysis on ASON. The intention of this paper is to present our perspective, in terms of evolution strategy toward ASON, on next generation optical networks. It is shown through experimental tests that the performance of current Pre-standard ASON enabled equipments satisfies the basic requirements of network operators and is ready for initial deployment. The results of the economic analysis show that network operators can be benefit from the deployment of ASON from three sides. Firstly, ASON can reduce the CAPEX for network expanding by integrating multiple ADM & DCS into one box. Secondly, ASON can reduce the OPEX for network operation by introducing automatic resource control scheme. Finally, ASON can increase margin revenue by providing new optical network services such as Bandwidth on Demand, optical VPN etc. Finally, the evolution strategy is proposed as our perspective toward next generation optical networks. We hope the evolution strategy introduced may be helpful for the network operators to gracefully migrate their fixed ring based legacy networks to next generation dynamic mesh based network.

  3. Field Testing GEOICE: A Next-Generation Polar Seismometer

    NASA Astrophysics Data System (ADS)

    Beaudoin, B. C.; Winberry, J. P.; Huerta, A. D.; Chung, P.; Parker, T.; Anderson, K. R.; Bilek, S. L.; Carpenter, P.

    2015-12-01

    We report on the development of a new NSF MRI-community supported seismic observatory designed for studies in ice-covered regions - the Geophysical Earth Observatory for Ice Covered Environs (GEOICE). This project is motivated by the need to densify and optimize the collection of high-quality seismic data relevant to key solid Earth and cryosphere science questions. The GEOICE instruments and their power and other ancillary systems are being designed to require minimal installation time and logistical load (i.e., size and weight), while maximizing ease-of-use in the field. The system is capable of advanced data handling and telemetry while being able to withstand conditions associated with icy environments, including cold/wet conditions and high-latitude solar limitations. The instrument capability will include a hybrid seismograph pool of broadband and intermediate elements for observation of both long-period signals (e.g, long-period surface waves and slow sources) and intermediate-to-short-period signals (e.g., teleseismic body waves, local seismicity, and impulsive or extended glaciogenic signals).Key features will include a design that integrates the seismometer and digitizer into a single, environmentally and mechanically robust housing; very low power requirements (~1 watt) for the intermediate-band systems; and advanced power systems that optimize battery capacity and operational limits. The envisioned ~100 element GEOICE instruments will nearly double the current polar inventory of stations and will be maintained and supported at the IRIS PASSCAL Instrument Center to ensure full and flexible peer-reviewed community use. Prototype instruments are currently deployed in Antarctica and Alaska, with a larger Antarctic deployment planned for the 2015-2016 season. The results of these field tests will help to refine instrumentation design and lead to the production of robust and capable next-generation seismic sensors.

  4. TRIPPING CIRCUIT

    DOEpatents

    Lees, G.W.; McCormick, E.D.

    1962-05-22

    A tripping circuit employing a magnetic amplifier for tripping a reactor in response to power level, period, or instrument failure is described. A reference winding and signal winding are wound in opposite directions on the core. Current from an ion chamber passes through both windings. If the current increases at too fast a rate, a shunt circuit bypasses one or the windings and the amplifier output reverses polarity. (AEC)

  5. Electrical Circuit Tester

    DOEpatents

    Love, Frank

    2006-04-18

    An electrical circuit testing device is provided, comprising a case, a digital voltage level testing circuit with a display means, a switch to initiate measurement using the device, a non-shorting switching means for selecting pre-determined electrical wiring configurations to be tested in an outlet, a terminal block, a five-pole electrical plug mounted on the case surface and a set of adapters that can be used for various multiple-pronged electrical outlet configurations for voltages from 100 600 VAC from 50 100 Hz.

  6. Retrieval Mode Distinguishes the Testing Effect from the Generation Effect

    ERIC Educational Resources Information Center

    Karpicke, Jeffrey D.; Zaromb, Franklin M.

    2010-01-01

    A series of four experiments examined the effects of generation vs. retrieval practice on subsequent retention. Subjects were first exposed to a list of target words. Then the subjects were shown the targets again intact for Read trials or they were shown fragments of the targets. Subjects in Generate conditions were told to complete the fragments…

  7. A Study of Power Systems Stability Enhancement Effects by Excitation Control of Superconducting Generator with High Response Excitation based on Detailed Excitation Circuit Model

    NASA Astrophysics Data System (ADS)

    Wu, Guohong; Shirato, Hideyuki

    SCG (Superconducting Generator) has a superconducting field winding, which leads to many advantages such as small size, high generation efficiency, low impedance, and so on, and be considered as one of the candidates to meet the needs of high stability and high efficiency in the future power system networks. SCG with high response excitation is especially expected to be able to enhance the transient stability of power system by its SMES (Superconducting Magnetic Energy System) effect. The SMES effect of SCG is recognized that its behaviors are dominated by the structures and controls of its excitation system. For this reason, in order to verify exactly how the SMES effect of SCG influences on the power system stability, the electrical circuits of SCG high response excitation are modeled in detail for conducting digital simulation, and its influence on excitation voltage and active power output of SCG are discussed as well. The simulation results with a typical one machine - infinite bus power system model shows that the SMES effect can be certainly obtained when its exciting power is supplied from SCG terminal bus and may considerably lead to an improvement of power system transient stability.

  8. Fabrication and In vivo Thrombogenicity Testing of Nitric Oxide Generating Artificial Lungs

    PubMed Central

    Amoako, Kagya A; Montoya, Patrick J; Major, Terry C; Suhaib, Ahmed B; Handa, Hitesh; Brant, David O; Meyerhoff, Mark E; Bartlett, Robert H; Cook, Keith E

    2013-01-01

    Hollow fiber artificial lungs are increasingly being used for long-term applications. However, clot formation limits their use to 1-2 weeks. This study investigated the effect of nitric oxide generating (NOgen) hollow fibers on artificial lung thrombogenicity. Silicone hollow fibers were fabricated to incorporate 50 nm copper particles as a catalyst for NO generation from the blood. Fibers with and without (control) these particles were incorporated into artificial lungs with a 0.1 m2 surface area and inserted in circuits coated tip-to-tip with the NOgen material. Circuits (N=5/each) were attached to rabbits in a pumpless, arterio-venous configuration and run for 4 hrs at an activated clotting time of 350-400s. Three control circuits clotted completely, while none of the NOgen circuits failed. Accordingly, blood flows were significantly higher in the NOgen group (95.9 ± 11.7, p < 0.01) compared to the controls (35.2 ± 19.7) (ml/min), and resistance was significantly higher in the control group after 4 hours (15.38 ± 9.65, p<0.001) than in NOgen (0.09 ± 0.03) (mmHg/mL/min). On the other hand, platelet counts and plasma fibrinogen concentration expressed as percent of baseline in control group (63.7 ± 5.7%, 77.2 ± 5.6% [p<0.05]) were greater than those in the NOgen group (60.4 ± 5.1%, 63.2 ± 3.7%). Plasma copper levels in the NOgen group were 2.8 times baseline at 4 hours (132.8 ± 4.5 μg/dl) and unchanged in the controls. This work demonstrates that NO generating gas exchange fibers could be a potentially effective way to control coagulation inside artificial lungs. PMID:23613156

  9. A fully enclosed, compact standard lightning impulse generator for testing ultra-high-voltage-class gas-insulated switchgears with high capacitance.

    PubMed

    Wen, Tao; Zhang, Qiaogen; Zhang, Lingli; Zhao, Junping; Liu, Xuandong; Li, Xiaoang; Guo, Can; You, Haoyang; Chen, Weijiang; Yin, Yu; Shi, Weidong

    2016-03-01

    At present, conducting standard lightning impulse (LI) tests in the field for gas-insulated switchgear (GIS) equipment is difficult because of the high capacitance of the test equipment and large circuit inductance of traditional impulse devices, which leads to a wavefront time T(f) ≥ 2.5 μs. A novel fully enclosed, compact standard LI generator for testing ultra-high-voltage-class GIS equipment with high capacitance is presented to solve the problem of T(f) exceeding the standard during LI voltage tests for actual large-sized equipment. The impulse generator is installed in a metal vessel filled with SF6 or SF6/N2 gas mixture at a pressure of 0.3-0.5 MPa, providing a more compact structure and a lower series inductance. A newly developed conical voltage sensor is used to accurately measure the output voltage waveform. Two test modes (via bushing docking and direct docking) for the GIS test based on the impulse generator are introduced. Calculation results show that the impulse generator can generate an LI test waveform following the present IEC standard for the test of equipment with capacitance >10,000 pF. PMID:27036815

  10. A fully enclosed, compact standard lightning impulse generator for testing ultra-high-voltage-class gas-insulated switchgears with high capacitance

    NASA Astrophysics Data System (ADS)

    Wen, Tao; Zhang, Qiaogen; Zhang, Lingli; Zhao, Junping; Liu, Xuandong; Li, Xiaoang; Guo, Can; You, Haoyang; Chen, Weijiang; Yin, Yu; Shi, Weidong

    2016-03-01

    At present, conducting standard lightning impulse (LI) tests in the field for gas-insulated switchgear (GIS) equipment is difficult because of the high capacitance of the test equipment and large circuit inductance of traditional impulse devices, which leads to a wavefront time Tf ≥ 2.5 μs. A novel fully enclosed, compact standard LI generator for testing ultra-high-voltage-class GIS equipment with high capacitance is presented to solve the problem of Tf exceeding the standard during LI voltage tests for actual large-sized equipment. The impulse generator is installed in a metal vessel filled with SF6 or SF6/N2 gas mixture at a pressure of 0.3-0.5 MPa, providing a more compact structure and a lower series inductance. A newly developed conical voltage sensor is used to accurately measure the output voltage waveform. Two test modes (via bushing docking and direct docking) for the GIS test based on the impulse generator are introduced. Calculation results show that the impulse generator can generate an LI test waveform following the present IEC standard for the test of equipment with capacitance >10 000 pF.

  11. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be... of this section, a cut-out circuit is any circuit which overrides the operation of automatic...

  12. A test of a dual central pattern generator hypothesis for subcortical control of locomotion.

    PubMed

    Guadagnoli, M A; Etnyre, B; Rodrigue, M L

    2000-08-01

    This study was designed to examine the nature of neural circuits involved in subcortical inter-limb coordination and reflex modulation mechanisms of locomotion. These circuits, called central pattern generators (CPGs), are believed to receive tonic input and generate rhythmically alternating sets of commands. Although CPGs have been theorized to exist in humans, their potential dual role in inter-limb coordination and reflex modulation is unclear. In the present study, nine participants walked on a treadmill, timing their heel-strikes to a metronome which varied the phase lag from 0.5 to 1.0 pi radians (0.1 pi intervals). A stimulus was delivered to the sural nerve and reflexes were measured in the ipsilateral and contralateral lower extremities through electromyography. The similarity between phase lag conditions for both temporal coordination (i.e., relative timing aspects between muscles and/or limbs) and reflex intensities suggested that they may be controlled by the same subcortical circuitry. Two plausible explanations exist: (1) a single CPG coordinates muscular contractions and phasically alters proprioceptive reflex modulation, as well as cutaneous input, using feed-forward control; (2) two separate circuits are strongly entrained, producing synchronous outputs for inter-limb coordination and reflex modulation. The out-of-phase task used in this study was limited in discerning such a difference, if it exists. PMID:10969197

  13. Receiver Gain Modulation Circuit

    NASA Technical Reports Server (NTRS)

    Jones, Hollis; Racette, Paul; Walker, David; Gu, Dazhen

    2011-01-01

    A receiver gain modulation circuit (RGMC) was developed that modulates the power gain of the output of a radiometer receiver with a test signal. As the radiometer receiver switches between calibration noise references, the test signal is mixed with the calibrated noise and thus produces an ensemble set of measurements from which ensemble statistical analysis can be used to extract statistical information about the test signal. The RGMC is an enabling technology of the ensemble detector. As a key component for achieving ensemble detection and analysis, the RGMC has broad aeronautical and space applications. The RGMC can be used to test and develop new calibration algorithms, for example, to detect gain anomalies, and/or correct for slow drifts that affect climate-quality measurements over an accelerated time scale. A generalized approach to analyzing radiometer system designs yields a mathematical treatment of noise reference measurements in calibration algorithms. By treating the measurements from the different noise references as ensemble samples of the receiver state, i.e. receiver gain, a quantitative description of the non-stationary properties of the underlying receiver fluctuations can be derived. Excellent agreement has been obtained between model calculations and radiometric measurements. The mathematical formulation is equivalent to modulating the gain of a stable receiver with an externally generated signal and is the basis for ensemble detection and analysis (EDA). The concept of generating ensemble data sets using an ensemble detector is similar to the ensemble data sets generated as part of ensemble empirical mode decomposition (EEMD) with exception of a key distinguishing factor. EEMD adds noise to the signal under study whereas EDA mixes the signal with calibrated noise. It is mixing with calibrated noise that permits the measurement of temporal-functional variability of uncertainty in the underlying process. The RGMC permits the evaluation of EDA by

  14. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each overcurrent... 46 Shipping 1 2012-10-01 2012-10-01 false Overcurrent protection and switched circuits....

  15. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each overcurrent... 46 Shipping 1 2013-10-01 2013-10-01 false Overcurrent protection and switched circuits....

  16. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each overcurrent... 46 Shipping 1 2010-10-01 2010-10-01 false Overcurrent protection and switched circuits....

  17. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each overcurrent... 46 Shipping 1 2014-10-01 2014-10-01 false Overcurrent protection and switched circuits....

  18. Towards a Framework for Generating Tests to Satisfy Complex Code Coverage in Java Pathfinder

    NASA Technical Reports Server (NTRS)

    Staats, Matt

    2009-01-01

    We present work on a prototype tool based on the JavaPathfinder (JPF) model checker for automatically generating tests satisfying the MC/DC code coverage criterion. Using the Eclipse IDE, developers and testers can quickly instrument Java source code with JPF annotations covering all MC/DC coverage obligations, and JPF can then be used to automatically generate tests that satisfy these obligations. The prototype extension to JPF enables various tasks useful in automatic test generation to be performed, such as test suite reduction and execution of generated tests.

  19. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... less than four seconds. (See 40 CFR 1065.514 for allowances in the cycle validation criteria.) (d... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065. (ii... CFR part 1065. (2) Torque is normalized to the maximum torque at the rpm listed with it. Therefore,...

  20. Improving Large Enrollment Undergraduate Instruction With Computer Generated, Repeatable Tests.

    ERIC Educational Resources Information Center

    Hammer, Mark; Henderson, C. Obert

    In addition to the usual drawbacks of large enrollment college classes such as impersonal atmosphere, discouragement of questions, and insensitivity to individual differences, the testing methods that tend to be associated with large classes can be detrimental to the learning process. Objective tests decrease the level of intellectual mastery…

  1. The next generation of microbiological testing of poultry

    Technology Transfer Automated Retrieval System (TEKTRAN)

    Microbiological testing of food products is a common practice of food processors to ensure compliance with food safety criteria. Sampling on its own is of limited value, but when applied regularly at different stages of the food chain, microbiology testing can be an integral part of a quality contr...

  2. Optical testing of cylindrical surfaces with computer-generated holograms

    NASA Astrophysics Data System (ADS)

    Wang, Wei; Guo, Pei-ji

    2013-08-01

    Increasing demands for highly accurate cylinders require more high-precision testing techniques. The existing methods of testing cylindrical surfaces can not ensure the highly-accuracy, efficiency, convenience and the overall cost. In order to acquire highly accurate cylindrical surfaces conveniently at a low cost, a new Fizeau interferometric optical testing utilizing CGH which is fabricated onto a wedge-shaped substrate is designed. In this test, a slit filter is placed in the center of the cylindrical curvature to filter out the undesired diffraction orders which occur when the beam hits the CGH. Meanwhile, the front side of the wedge-shaped substrate is as the reference flat, and the CGH is written onto the inclined surface, so that the real fringe pattern can not be affected by its reflected beam. Moreover, the design of cylindrical surfaces under test tilting and off-center relative to the diffraction surface of the CGH results that the required rays for interference can be obtained effectively from the pinhole filter in the interferometer. Furthermore, high-accuracy CGH in this test can be processed by conventional microlithography equipments. Corresponding to a cylindrical surface with 60mm in diameter and f-number of 1/7, the test has been successfully designed and optimized in Zemax whose testing accuracy is prior to 0.0019λ. Better interference pattern can be obtained because all the other disturbing rays image outside of aperture in a radius of 2mm. Experiment shows the method is efficient and predominant.

  3. MULTIPLIER CIRCUIT

    DOEpatents

    Chase, R.L.

    1963-05-01

    An electronic fast multiplier circuit utilizing a transistor controlled voltage divider network is presented. The multiplier includes a stepped potentiometer in which solid state or transistor switches are substituted for mechanical wipers in order to obtain electronic switching that is extremely fast as compared to the usual servo-driven mechanical wipers. While this multiplier circuit operates as an approximation and in steps to obtain a voltage that is the product of two input voltages, any desired degree of accuracy can be obtained with the proper number of increments and adjustment of parameters. (AEC)

  4. DESIGN, FABRICATION, AND TESTING OF AN ADVANCED, NON-POLLUTING TURBINE DRIVE GAS GENERATOR

    SciTech Connect

    Unknown

    2002-03-31

    The objectives of this report period were to complete the development of the Gas Generator design, which was done; fabricate and test of the non-polluting unique power turbine drive gas Gas Generator, which has been postponed. Focus during this report period has been to complete the brazing and bonding necessary to fabricate the Gas Generator hardware, continue making preparations for fabricating and testing the Gas Generator, and continuing the fabrication of the Gas Generator hardware and ancillary hardware in preparation for the test program. Fabrication is more than 95% complete and is expected to conclude in early May 2002. the test schedule was affected by relocation of the testing to another test supplier. The target test date for hot fire testing is now not earlier than June 15, 2002.

  5. Circuit bridging of components by smoke

    SciTech Connect

    Tanaka, T.J.; Nowlen, S.P.; Anderson, D.J.

    1996-10-01

    Smoke can adversely affect digital electronics; in the short term, it can lead to circuit bridging and in the long term to corrosion of metal parts. This report is a summary of the work to date and component-level tests by Sandia National Laboratories for the Nuclear Regulatory Commission to determine the impact of smoke on digital instrumentation and control equipment. The component tests focused on short-term effects such as circuit bridging in typical components and the factors that can influence how much the smoke will affect them. These factors include the component technology and packaging, physical board protection, and environmental conditions such as the amount of smoke, temperature of burn, and humidity level. The likelihood of circuit bridging was tested by measuring leakage currents and converting those currents to resistance in ohms. Hermetically sealed ceramic packages were more resistant to smoke than plastic packages. Coating the boards with an acrylic spray provided some protection against circuit bridging. The smoke generation factors that affect the resistance the most are humidity, fuel level, and burn temperature. The use of CO{sub 2} as a fire suppressant, the presence of galvanic metal, and the presence of PVC did not significantly affect the outcome of these results.

  6. Automatically generated acceptance test: A software reliability experiment

    NASA Technical Reports Server (NTRS)

    Protzel, Peter W.

    1988-01-01

    This study presents results of a software reliability experiment investigating the feasibility of a new error detection method. The method can be used as an acceptance test and is solely based on empirical data about the behavior of internal states of a program. The experimental design uses the existing environment of a multi-version experiment previously conducted at the NASA Langley Research Center, in which the launch interceptor problem is used as a model. This allows the controlled experimental investigation of versions with well-known single and multiple faults, and the availability of an oracle permits the determination of the error detection performance of the test. Fault interaction phenomena are observed that have an amplifying effect on the number of error occurrences. Preliminary results indicate that all faults examined so far are detected by the acceptance test. This shows promise for further investigations, and for the employment of this test method on other applications.

  7. R. F. testing of the third generation defense communication satellite

    NASA Technical Reports Server (NTRS)

    Sargent, J.; Massaro, M.

    1980-01-01

    The approach taken to test a completed DSCS communications satellite on a system level is described. Areas to be described are measuring RF isolation of separate communications subsystems and a test method which insures that one RF subsystem does not interfere with another. In addition, the method of complying with MIL-STD-1541 in the area of demonstrating safety of electroexplosive devices in an RF field is discussed.

  8. MHDL CAD tool with fault circuit handling

    NASA Astrophysics Data System (ADS)

    Espinosa Flores-Verdad, Guillermo; Altamirano Robles, Leopoldo; Osorio Roque, Leticia

    2003-04-01

    Behavioral modeling and simulation, with Analog Hardware and Mixed Signal Description High Level Languages (MHDLs), have generated the development of diverse simulation tools that allow handling the requirements of the modern designs. These systems have million of transistors embedded and they are radically diverse between them. This tendency of simulation tools is exemplified by the development of languages for modeling and simulation, whose applications are the re-use of complete systems, construction of virtual prototypes, realization of test and synthesis. This paper presents the general architecture of a Mixed Hardware Description Language, based on the standard 1076.1-1999 IEEE VHDL Analog and Mixed-Signal Extensions known as VHDL-AMS. This architecture is novel by consider the modeling and simulation of faults. The main modules of the CAD tool are briefly described in order to establish the information flow and its transformations, starting from the description of a circuit model, going throw the lexical analysis, mathematical models generation and the simulation core, ending at the collection of the circuit behavior as simulation"s data. In addition, the incorporated mechanisms to the simulation core are explained in order to realize the handling of faults into the circuit models. Currently, the CAD tool works with algebraic and differential descriptions for the circuit models, nevertheless the language design is open to be able to handle different model types: Fuzzy Models, Differentials Equations, Transfer Functions and Tables. This applies for fault models too, in this sense the CAD tool considers the inclusion of mutants and saboteurs. To exemplified the results obtained until now, the simulated behavior of a circuit is shown when it is fault free and when it has been modified by the inclusion of a fault as a mutant or a saboteur. The obtained results allow the realization of a virtual diagnosis for mixed circuits. This language works in a UNIX system

  9. Circuit Training.

    ERIC Educational Resources Information Center

    Nelson, Jane B.

    1998-01-01

    Describes a research-based activity for high school physics students in which they build an LC circuit and find its resonant frequency of oscillation using an oscilloscope. Includes a diagram of the apparatus and an explanation of the procedures. (DDR)

  10. Transcriptional Profiling of Newly Generated Dentate Granule Cells Using TU Tagging Reveals Pattern Shifts in Gene Expression during Circuit Integration1,2

    PubMed Central

    Chatzi, Christina; Shen, Rongkun; Goodman, Richard H.

    2016-01-01

    Abstract Despite representing only a small fraction of hippocampal granule cells, adult-generated newborn granule cells have been implicated in learning and memory (Aimone et al., 2011). Newborn granule cells undergo functional maturation and circuit integration over a period of weeks. However, it is difficult to assess the accompanying gene expression profiles in vivo with high spatial and temporal resolution using traditional methods. Here we used a novel method [“thiouracil (TU) tagging”] to map the profiles of nascent mRNAs in mouse immature newborn granule cells compared with mature granule cells. We targeted a nonmammalian uracil salvage enzyme, uracil phosphoribosyltransferase, to newborn neurons and mature granule cells using retroviral and lentiviral constructs, respectively. Subsequent injection of 4-TU tagged nascent RNAs for analysis by RNA sequencing. Several hundred genes were significantly enhanced in the retroviral dataset compared with the lentiviral dataset. We compared a selection of the enriched genes with steady-state levels of mRNAs using quantitative PCR. Ontology analysis revealed distinct patterns of nascent mRNA expression, with newly generated immature neurons showing enhanced expression for genes involved in synaptic function, and neural differentiation and development, as well as genes not previously associated with granule cell maturation. Surprisingly, the nascent mRNAs enriched in mature cells were related to energy homeostasis and metabolism, presumably indicative of the increased energy demands of synaptic transmission and their complex dendritic architecture. The high spatial and temporal resolution of our modified TU-tagging method provides a foundation for comparison with steady-state RNA analyses by traditional transcriptomic approaches in defining the functional roles of newborn neurons. PMID:27011954

  11. Testing conditions in shock-based contextual fear conditioning influence both the behavioral responses and the activation of circuits potentially involved in contextual avoidance.

    PubMed

    Viellard, Juliette; Baldo, Marcus Vinicius C; Canteras, Newton Sabino

    2016-12-15

    Previous studies from our group have shown that risk assessment behaviors are the primary contextual fear responses to predatory and social threats, whereas freezing is the main contextual fear response to physically harmful events. To test contextual fear responses to a predator or aggressive conspecific threat, we developed a model that involves placing the animal in an apparatus where it can avoid the threat-associated environment. Conversely, in studies that use shock-based fear conditioning, the animals are usually confined inside the conditioning chamber during the contextual fear test. In the present study, we tested shock-based contextual fear responses using two different behavioral testing conditions: confining the animal in the conditioning chamber or placing the animal in an apparatus with free access to the conditioning compartment. Our results showed that during the contextual fear test, the animals confined to the shock chamber exhibited significantly more freezing. In contrast, the animals that could avoid the conditioning compartment displayed almost no freezing and exhibited risk assessment responses (i.e., crouch-sniff and stretch postures) and burying behavior. In addition, the animals that were able to avoid the shock chamber had increased Fos expression in the juxtadorsomedial lateral hypothalamic area, the dorsomedial part of the dorsal premammillary nucleus and the lateral and dorsomedial parts of the periaqueductal gray, which are elements of a septo/hippocampal-hypothalamic-brainstem circuit that is putatively involved in mediating contextual avoidance. Overall, the present findings show that testing conditions significantly influence both behavioral responses and the activation of circuits involved in contextual avoidance. PMID:27544875

  12. GMOtrack: generator of cost-effective GMO testing strategies.

    PubMed

    Novak, Petra Krau; Gruden, Kristina; Morisset, Dany; Lavrac, Nada; Stebih, Dejan; Rotter, Ana; Zel, Jana

    2009-01-01

    Commercialization of numerous genetically modified organisms (GMOs) has already been approved worldwide, and several additional GMOs are in the approval process. Many countries have adopted legislation to deal with GMO-related issues such as food safety, environmental concerns, and consumers' right of choice, making GMO traceability a necessity. The growing extent of GMO testing makes it important to study optimal GMO detection and identification strategies. This paper formally defines the problem of routine laboratory-level GMO tracking as a cost optimization problem, thus proposing a shift from "the same strategy for all samples" to "sample-centered GMO testing strategies." An algorithm (GMOtrack) for finding optimal two-phase (screening-identification) testing strategies is proposed. The advantages of cost optimization with increasing GMO presence on the market are demonstrated, showing that optimization approaches to analytic GMO traceability can result in major cost reductions. The optimal testing strategies are laboratory-dependent, as the costs depend on prior probabilities of local GMO presence, which are exemplified on food and feed samples. The proposed GMOtrack approach, publicly available under the terms of the General Public License, can be extended to other domains where complex testing is involved, such as safety and quality assurance in the food supply chain. PMID:20166592

  13. NEXT GENERATION SEDIMENT TOXICITY TESTING VIA DNA MICROARRAYS - PHASE I

    EPA Science Inventory

    The current SBIR solicitation states that the EPA is seeking “better sampling, analysis, and monitoring technologies” to improve hazardous waste management.  Development of new methods for testing contaminated sediments is an area of particular concern because many industri...

  14. Acceptance Test Report for Fourth Generation Hanford Corrosion Monitoring System

    SciTech Connect

    NORMAN, E.C.

    2000-10-23

    This Acceptance Test Report (ATR) will document the satisfactory operation of the corrosion probe cabinets destined for installation on tanks 241-AN-102 and 241-AN-107. This ATR will be performed by the manufacturer on each cabinet prior to delivery to the site. The objective of this procedure is to demonstrate and document the acceptance of the corrosion monitoring cabinets to be installed on tanks 241-AN-102 and 241-AN-107. One cabinet will be installed on each tank. Each cabinet will contain corrosion monitoring hardware to be connected to existing corrosion probes already installed in each tank. The test will consist of a continuity test of the cabinet wiring from the end of cable to be connected to corrosion probe, through the appropriate intrinsic safety barriers and out to the 15 pin D-shell connectors to be connected to the corrosion monitoring instrument. Additional testing will be performed using a constant current and voltage source provided by the corrosion monitoring hardware manufacturer to verify proper operation of corrosion monitoring instrumentation (input a known signal and see if the instrumentation records the proper value).

  15. Acceptance test plan for fourth generation Hanford corrosion monitoring system

    SciTech Connect

    NORMAN, E.C.

    2000-07-27

    This Acceptance Test Plan (ATP) will document the satisfactory operation of the corrosion probe cabinets destined for installation on tanks 241-AN-102 and 241-AN-107. This ATP will be performed by the manufacturer on each cabinet prior to delivery to the site. The objective of this procedure is to demonstrate and document the acceptance of the corrosion monitoring cabinets to be installed on tanks 241-AN-102 and 241-AN-107. One cabinet will be installed on each tank. Each cabinet will contain corrosion monitoring hardware to be connected to existing corrosion probes already installed in each tank. The test will consist of a continuity test of the cabinet wiring from the end of cable to be connected to corrosion probe, through the appropriate intrinsic safety barriers and out to the 15 pin D-shell connectors to be connected to the corrosion monitoring instrument. Additional testing will be performed using a constant current and voltage source provided by the corrosion monitoring hardware manufacturer to verify proper operation of corrosion monitoring instrumentation (input a known signal and see if the instrumentation records the proper value).

  16. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... test. The torque and rpm feedback signals may be filtered. (d) Idle Speed Enhancement Devices (e.g... feedback torque equal to zero (using, for example, clutch disengagement, speed to torque control switching... longer, the average feedback torque must be within ±10 ft-lbs of zero. To allow for transition, up to...

  17. Electrifying Inquiry: Electrical Circuits

    ERIC Educational Resources Information Center

    Godbey, Susan; Barnett, Jessica; Webster, Lois

    2005-01-01

    An activity involving parallel electrical circuits was modified to incorporate an open inquiry approach. Both the original and revised versions of the activity were tested in the middle school classroom. We present a comparison of the two versions of the activity in terms of facilitating learning and engaging students' interests.

  18. Endurance testing of first generation (Block 1) commercial solar cell modules

    NASA Technical Reports Server (NTRS)

    Anagnostou, E.; Forestieri, A. F.

    1978-01-01

    To determine lifetimes of the first generation (Block 1) commercial solar cell modules used in solar cell arrays, a program was initiated to expose these modules to a range of environments. The conditions endured by these modules encompassed hot and dry, hot and humid, tropical rain forests, sea-air, urban industrial and urban clean. Exposures were for periods up to 1 year. The effect of outdoor exposure on the performance of the modules was determined using current-voltage curves. Short-circuit current (I sub sc) and maximum power (P sub max) were the parameters monitored. In all cases, there was a loss of performance of the modules with outdoor exposure.

  19. TID Test Results for 4th Generation iPad(TradeMark)

    NASA Technical Reports Server (NTRS)

    Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A.

    2013-01-01

    TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.

  20. Removing Bonded Integrated Circuits From Boards

    NASA Technical Reports Server (NTRS)

    Rice, John T.

    1989-01-01

    Small resistance heater makes it easier, faster, and cheaper to remove integrated circuit from hybrid-circuit board, package, or other substrate for rework. Heater, located directly in polymeric bond interface or on substrate under integrated-circuit chip, energized when necessary to remove chip. Heat generated softens adhesive or solder that bonds chip to substrate. Chip then lifted easily from substrate.

  1. Parametric Analysis of a Hover Test Vehicle using Advanced Test Generation and Data Analysis

    NASA Technical Reports Server (NTRS)

    Gundy-Burlet, Karen; Schumann, Johann; Menzies, Tim; Barrett, Tony

    2009-01-01

    Large complex aerospace systems are generally validated in regions local to anticipated operating points rather than through characterization of the entire feasible operational envelope of the system. This is due to the large parameter space, and complex, highly coupled nonlinear nature of the different systems that contribute to the performance of the aerospace system. We have addressed the factors deterring such an analysis by applying a combination of technologies to the area of flight envelop assessment. We utilize n-factor (2,3) combinatorial parameter variations to limit the number of cases, but still explore important interactions in the parameter space in a systematic fashion. The data generated is automatically analyzed through a combination of unsupervised learning using a Bayesian multivariate clustering technique (AutoBayes) and supervised learning of critical parameter ranges using the machine-learning tool TAR3, a treatment learner. Covariance analysis with scatter plots and likelihood contours are used to visualize correlations between simulation parameters and simulation results, a task that requires tool support, especially for large and complex models. We present results of simulation experiments for a cold-gas-powered hover test vehicle.

  2. Detector verifier for circuit analyzers

    NASA Technical Reports Server (NTRS)

    Pope, D. L.; Wooters, R. L.

    1980-01-01

    Economical tool checks operation of automatic circuit analyzer. Each loop is addressed directly from analyzer console by switching internal analyzer bridge to resistance equal that of connecting cable plus specified limiting test value. Procedure verifies whether detected faults in circuit under test are actually due to analyzer malfunction. Standard-length universal test cables make it possible to shift detector tool from cable to cable without resistance compensation.

  3. Tests of the radiation hardness of VLSI Integrated Circuits and Silicon Strip Detectors for the SSC (Superconducting Super Collider) under neutron, proton, and gamma irradiation

    SciTech Connect

    Ziock, H.J.; Milner, C.; Sommer, W.F. ); Carteglia, N.; DeWitt, J.; Dorfan, D.; Hubbard, B.; Leslie, J.; O'Shaughnessy, K.F.; Pitzl, D.; Rowe, W.A.; Sadrozinski, H.F.W.; Seiden, A.; Spencer, E. . Inst. for Particle Physics); Ellison, J.A. ); Ferguson, P. ); Giubellino

    1990-01-01

    As part of a program to develop a silicon strip central tracking detector system for the Superconducting Super Collider (SSC) we are studying the effects of radiation damage in silicon detectors and their associated front-end readout electronics. We report on the results of neutron and proton irradiations at the Los Alamos National Laboratory (LANL) and {gamma}-ray irradiations at UC Santa Cruz (UCSC). Individual components on single-sided AC-coupled silicon strip detectors and on test structures were tested. Circuits fabricated in a radiation hard CMOS process and individual transistors fabricated using dielectric isolation bipolar technology were also studied. Results indicate that a silicon strip tracking detector system should have a lifetime of at least one decade at the SSC. 17 refs., 17 figs.

  4. Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiation

    SciTech Connect

    Ziock, H.J.; Milner, C.; Sommer, W.F. ); Cartiglia, N.; DeWitt, J.; Dorfan, D.; Hubbard, B.; Leslie, J.; O'Shaughnesy, K.F.; Pitzl, D.; Rowe, W.A.; Sadrozinski, H.F.W.; Seiden, A.; Spencer, E.; Tennenbaum, P. . Inst. for Particle Physics); Ellison, J.; Jerger, S.; Lietzke, C.; Wimpenny, S.J. ); Ferguson, P. ); Giubellino, P. )

    1991-04-01

    As part of a program to develop a silicon strip central tracking detector system for the Superconducting Super Collider (SSC) we are studying the effects of radiation damage in silicon detectors and their associated front-end readout electronics. In this paper, the authors report on the results of neutron and proton irradiations at the Los Alamos National Laboratory (LANL) and {gamma}-ray irradiations at U.C. Santa Cruz (UCSC). Individual components on single-sided AC-coupled silicon strip detectors and on test structures were tested. Circuits fabricated in a radiation hard CMOS process and individual transistors fabricated using dielectric isolation bipolar technology were also studied. Results indicate that a silicon strip tracking detector system should have a lifetime of at least one decade at the SSC.

  5. Generating Random Parallel Test Forms Using CTT in a Computer-Based Environment.

    ERIC Educational Resources Information Center

    Weiner, John A.; Gibson, Wade M.

    1998-01-01

    Describes a procedure for automated-test-forms assembly based on Classical Test Theory (CTT). The procedure uses stratified random-content sampling and test-form preequating to ensure both content and psychometric equivalence in generating virtually unlimited parallel forms. Extends the usefulness of CTT in automated test construction. (Author/SLD)

  6. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be tested at least once every three months to determine that the circuit functions as intended. For...

  7. Generation and Testing of Autonomous Mineral Detectors for Mars Rovers

    NASA Astrophysics Data System (ADS)

    Merrill, M. D.; Gilmore, M. S.; Castaño, R.; Bornstein, B.; Greenwood, J.

    2004-05-01

    Currently Mars missions can collect more data than can be returned. Autonomous systems for data collection, processing and return will aid future Mars rovers in prioritizing and returning geologically important information. We have created a neural net detector that is able to successfully recognize carbonates from Visible/NIR (350-2500 nm) spectra of rocks collected from Mars analog environments (Gilmore et al. JGR 105, 29,223). In order to characterize and improve the detector's sensitivity, we are evaluating the performance of the detector under more realistic Martian environments: 1) carbonate minerals covered with palagonitic dust, and 2) carbonate minerals intimately mixed with basalt and palagonite. Lessons learned will be applied to the generation of additional detectors for minerals of interest (e.g., hydrothermal minerals). Aliquots of Martian Soil Simulant JSC Mars-1 palagonite were sieved to <45 microns and air fall deposited onto a calcite crystal and an adjacent glass slide. Spectra in the Vis/NIR were taken of the calcite after every layer up to a thickness of 270 microns (35 layers) with an Analytical Spectral Devices Field Spec Pro spectrometer operating from 350-2500 nm. The carbonate detector, operating over the range 2000-2400 nm, has an empirically established detection threshold based on training with thousands of synthetic linear combinations of laboratory mineral spectra designed to simulate expected Martian rocks. The detection threshold was reached in this experiment when the dust layer thickness reached 102 -116 microns (78-85% aerial coverage). This corresponds to a real change in the depth of the 2300 nm carbonate band (continuum depth, D= 1- [reflectance at trough center/reflectance at continuum] = ~0.1), and is similar to the detection threshold of the human experimenter. Very thin (~10-20 microns) coatings of palagonite dust had a large effect on the spectral response of the substrate, exemplifying the nonlinear mixing of the two

  8. Instructional Topics in Educational Measurement (ITEMS) Module: Using Automated Processes to Generate Test Items

    ERIC Educational Resources Information Center

    Gierl, Mark J.; Lai, Hollis

    2013-01-01

    Changes to the design and development of our educational assessments are resulting in the unprecedented demand for a large and continuous supply of content-specific test items. One way to address this growing demand is with automatic item generation (AIG). AIG is the process of using item models to generate test items with the aid of computer…

  9. CD-ROM Based Multimedia Homework Solutions and Self Test Generator.

    ERIC Educational Resources Information Center

    Rhodes, Jeffrey M.; Bell, Christopher C.

    1998-01-01

    Discusses a prototype multimedia application that was designed to help college students solve problems and generate practice tests for an economics textbook. Highlights include step-by-step problem solving; a friendly interface; student tracking; inexpensive development costs; examples of screen displays; and generating random, scored tests on…

  10. The case for endurance testing of sodium-heated steam generators

    SciTech Connect

    Onesto, A.T.; Zweig, H.R.; Gibbs, D.C. . Rocketdyne Division.); Carlson, R.D. ); Rodwell, E. ); Kakarala, C.R. )

    1993-08-01

    After operating pressurized water reactor (PWR) steam generators in U.S. nuclear plants during the past 33 years and plugging thousands of tubes and replacing numerous steam generators at immense costs, utility and steam generator designers are now confident that they can design, build, and operate PWR steam generators successfully. Deployment of liquid-metal fast breeder reactors (LMFBRs) will likely follow the same scenario if long-term testing is not performed and development completed prior to commercial deployment. A case is made for endurance testing of steam generators to be used in future LMFBRs.

  11. Coincident steam generator tube rupture and stuck-open safety relief valve carryover tests: MB-2 steam generator transient response test program

    SciTech Connect

    Garbett, K; Mendler, O J; Gardner, G C; Garnsey, R; Young, M Y

    1987-03-01

    In PWR steam generator tube rupture (SGTR) faults, a direct pathway for the release of radioactive fission products can exist if there is a coincident stuck-open safety relief valve (SORV) or if the safety relief valve is cycled. In addition to the release of fission products from the bulk steam generator water by moisture carryover, there exists the possibility that some primary coolant may be released without having first mixed with the bulk water - a process called primary coolant bypassing. The MB-2 Phase II test program was designed specifically to identify the processes for droplet carryover during SGTR faults and to provide data of sufficient accuracy for use in developing physical models and computer codes to describe activity release. The test program consisted of sixteen separate tests designed to cover a range of steady-state and transient fault conditions. These included a full SGTR/SORV transient simulation, two SGTR overfill tests, ten steady-state SGTR tests at water levels ranging from very low levels in the bundle up to those when the dryer was flooded, and three moisture carryover tests without SGTR. In these tests the influence of break location and the effect of bypassing the dryer were also studied. In a final test the behavior with respect to aerosol particles in a dry steam generator, appropriate to a severe accident fault, was investigated.

  12. Integrated Circuit Immunity

    NASA Technical Reports Server (NTRS)

    Sketoe, J. G.; Clark, Anthony

    2000-01-01

    This paper presents a DOD E3 program overview on integrated circuit immunity. The topics include: 1) EMI Immunity Testing; 2) Threshold Definition; 3) Bias Tee Function; 4) Bias Tee Calibration Set-Up; 5) EDM Test Figure; 6) EMI Immunity Levels; 7) NAND vs. and Gate Immunity; 8) TTL vs. LS Immunity Levels; 9) TP vs. OC Immunity Levels; 10) 7805 Volt Reg Immunity; and 11) Seventies Chip Set. This paper is presented in viewgraph form.

  13. Next-generation PIR security sensors: concept testing and evaluation

    NASA Astrophysics Data System (ADS)

    Liddiard, Kevin C.

    2009-05-01

    In previous presentations to this SPIE forum a new technology was outlined aimed at replacing pyroelectric sensors with resistance microbolometer MOEMS-based sensors capable of vastly superior performance. The technology can be implemented as either a PCB replacement to current sensors, giving extended detection range and ability to sense slow temperature change, or a 'smart' sensor with further performance enhancements and imaging capability. This paper reports the results of new laboratory and field tests of a laboratory prototype sensor and extrapolates these results to performance of production sensors. In particular, results are presented for NETD, detection range for human targets and detection of simulated electrical faults and developing fires. Previous results were reported for FPA operated without evacuation and using a low cost plastic Fresnel lens. However with wafer level packaging now becoming widely available in MEMS and CMOS foundries, much high performance can be achieved, opening up many additional applications. Performance of new FPAs designed for vacuum packaging is highlighted.

  14. Development and Demonstration of an Ada Test Generation System

    NASA Technical Reports Server (NTRS)

    1996-01-01

    In this project we have built a prototype system that performs Feasible Path Analysis on Ada programs: given a description of a set of control flow paths through a procedure, and a predicate at a program point feasible path analysis determines if there is input data which causes execution to flow down some path in the collection reaching the point so that tile predicate is true. Feasible path analysis can be applied to program testing, program slicing, array bounds checking, and other forms of anomaly checking. FPA is central to most applications of program analysis. But, because this problem is formally unsolvable, syntactic-based approximations are used in its place. For example, in dead-code analysis the problem is to determine if there are any input values which cause execution to reach a specified program point. Instead an approximation to this problem is computed: determine whether there is a control flow path from the start of the program to the point. This syntactic approximation is efficiently computable and conservative: if there is no such path the program point is clearly unreachable, but if there is such a path, the analysis is inconclusive, and the code is assumed to be live. Such conservative analysis too often yields unsatisfactory results because the approximation is too weak. As another example, consider data flow analysis. A du-pair is a pair of program points such that the first point is a definition of a variable and the second point a use and for which there exists a definition-free path from the definition to the use. The sharper, semantic definition of a du-pair requires that there be a feasible definition-free path from the definition to the use. A compiler using du-pairs for detecting dead variables may miss optimizations by not considering feasibility. Similarly, a program analyzer computing program slices to merge parallel versions may report conflicts where none exist. In the context of software testing, feasibility analysis plays an

  15. Gas Generation Testing of Neptunium Oxide Generated Using the HB-Line Phase IIFlowsheet

    SciTech Connect

    Duffey, J

    2003-08-29

    The hydrogen (H{sub 2}) gas generation rate for neptunium dioxide (NpO{sub 2}) samples produced on a laboratory scale using the HB-Line Phase II flowsheet has been measured following exposure to 75% relative humidity (RH). As expected, the observed H{sub 2} generation rates for these samples increase with increasing moisture content. A maximum H{sub 2} generation rate of 1.8 x 10{sup -6} moles per day per kilogram (mol {center_dot} day{sup -1} kg{sup -1}) was observed for NpO{sub 2} samples with approximately one and one-half times (1 1/2 X) the expected specific surface area (SSA) for the HB-Line Phase II product. The SSA of NpO{sub 2} samples calcined at 650 C is similar to plutonium dioxide (PuO{sub 2}) calcined at 950 C according to the Department of Energy (DOE) standard for packaging and storage of PuO{sub 2}. This low SSA of the HB-Line Phase II product limits moisture uptake to less than 0.2 weight percent (wt %) even with extended exposure to 75% RH.

  16. Test case set generation method on MC/DC based on binary tree

    NASA Astrophysics Data System (ADS)

    Wang, Jun-jie; Zhang, Bo; Chen, Yuan

    2013-03-01

    Exploring efficient, reliable test case design methods has been tester pursuit of the goal. Along with the aerospace software logic complexity of improving and software scale enlarging, this requirement also gets more compelling. Test case design techniques suited for MC/DC improved test case design efficiency, increase the test coverage. It is suitable to test the software that logical relationship is complicated comparatively. Some software test tools provide the function to calculate the test coverage. And it can assess the test cases whether on the MC/DC or not. But the software tester needs the reverse thinking. The paper puts forward that design the test case by Unique-cause and Masking approach. And it proposes automatic generation method of test case on MC/DC. It improved the efficiency and correctness of generation the test case set on DC/DC.

  17. Summary of DEEP STEAM downhole steam generator development activities. [Kern River and Long Beach field tests

    SciTech Connect

    Donaldson, A.B.; Fox, R.L.; Mulac, A.J.

    1981-01-01

    In this paper the concept and goals of the DOE program, DEEP STEAM, as related to the development of a downhole steam generator for deep heavy oil recovery will be discussed. Additionally, the past, present and future activities of the development program being carried out at Sandia National Laboratories will be discussed. These include evaluation studies, surface testing at Bakersfield, CA, a run-in test at Hobbs, NM, and status of field testing at Long Beach, CA. The Long Beach test includes both a downhole diesel-air generator and a surface diesel-oxygen generator. 7 figures.

  18. Automatic Generation of Rasch-Calibrated Items: Figural Matrices Test GEOM and Endless-Loops Test EC

    ERIC Educational Resources Information Center

    Arendasy, Martin

    2005-01-01

    The future of test construction for certain psychological ability domains that can be analyzed well in a structured manner may lie--at the very least for reasons of test security--in the field of automatic item generation. In this context, a question that has not been explicitly addressed is whether it is possible to embed an item response theory…

  19. Genetic Algorithm-Based Test Data Generation for Multiple Paths via Individual Sharing

    PubMed Central

    Gong, Dunwei

    2014-01-01

    The application of genetic algorithms in automatically generating test data has aroused broad concerns and obtained delightful achievements in recent years. However, the efficiency of genetic algorithm-based test data generation for path testing needs to be further improved. In this paper, we establish a mathematical model of generating test data for multiple paths coverage. Then, a multipopulation genetic algorithm with individual sharing is presented to solve the established model. We not only analyzed the performance of the proposed method theoretically, but also applied it to various programs under test. The experimental results show that the proposed method can improve the efficiency of generating test data for many paths' coverage significantly. PMID:25691894

  20. Simple circuit produces high-speed, fixed duration pulses

    NASA Technical Reports Server (NTRS)

    Garrahan, N. M.

    1965-01-01

    Circuit generates an output pulse of fixed width from a variable width input pulse. The circuit consists of a tunnel diode in parallel with an inductance driven by a constant current generator. It is used for pulsed communication equipment design.