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Sample records for force microscope cantilevers

  1. Cantilever based optical interfacial force microscope

    NASA Astrophysics Data System (ADS)

    Bonander, Jeremy R.; Kim, Byung I.

    2008-03-01

    We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

  2. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

    SciTech Connect

    Gates, Richard S.; Reitsma, Mark G.

    2007-08-15

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  3. Lateral force microscope calibration using a modified atomic force microscope cantilever

    SciTech Connect

    Reitsma, M. G.

    2007-10-15

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.

  4. Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors

    SciTech Connect

    Beaulieu, L.Y.; Godin, Michel; Laroche, Olivier; Tabard-Cossa, Vincent; Gruetter, Peter

    2006-02-20

    Most atomic force microscopes and cantilever-based sensors use an optical laser beam detection system to monitor cantilever deflections. We have developed a working model that accurately describes the way in which a position sensitive photodetector interprets the deflection of a cantilever in these instruments. This model exactly predicts the numerical relationship between the measured photodetector signal and the actual cantilever deflection. In addition, the model is used to optimize the geometry of such laser deflection systems, which greatly simplifies the use of any cantilever-based instrument that uses a laser beam detection system.

  5. High-speed force mapping on living cells with a small cantilever atomic force microscope.

    PubMed

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed. PMID:25085142

  6. High-speed force mapping on living cells with a small cantilever atomic force microscope

    NASA Astrophysics Data System (ADS)

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  7. High-speed force mapping on living cells with a small cantilever atomic force microscope

    SciTech Connect

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  8. Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

    NASA Astrophysics Data System (ADS)

    Kim, Byung I.; Bonander, Jeremy R.; Rasmussen, Jared A.

    2011-05-01

    We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges.

  9. Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope.

    PubMed

    Kim, Byung I; Bonander, Jeremy R; Rasmussen, Jared A

    2011-05-01

    We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges. PMID:21639511

  10. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  11. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

    SciTech Connect

    Chung, Koo-Hyun; Reitsma, Mark G.

    2010-02-15

    This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

  12. Intermittent contact interaction between an atomic force microscope cantilever and a nanowire

    NASA Astrophysics Data System (ADS)

    Knittel, I.; Ungewitter, L.; Hartmann, U.

    2012-05-01

    We investigate in theory and experiment the intermittent contact interaction between an atomic force microscope (AFM) cantilever and a nanowire under ambient conditions. The nanowire is modeled as a spring reacting instantaneously to any change of the force between the wire and the cantilever. This implies that the cantilever is subject to an "effective" force-distance relation, containing not only the surface forces but also the deflection of the nanowire. Experimentally, CVD-grown tin oxide nanowires and lithographically structured silicon nanowire arrays were investigated by intermittent contact AFM. By comparison of experimental and simulated distance-dependent resonance curves it is found that the nanowires behave like "fast nanosprings" and that the adhesion force is one of the key factors determining distance-dependent resonance curves. The results are fully applicable to a scenario in which a cantilever equipped by a nanowire interacts with a surface.

  13. Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

    SciTech Connect

    Sader, John E.; Friend, James R.

    2014-11-15

    A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on the resonant frequency and quality factor of the cantilever in fluid (typically air). This method eliminates the need to measure the hydrodynamic function of the cantilever, which can be time consuming given the wide range of cantilevers now available. Using laser Doppler vibrometry, we rigorously assess the accuracy of this method for a series of commercially available cantilevers and explore its performance under non-ideal conditions. This shows that the simplified method is highly accurate and can be easily implemented to perform fast, robust, and non-invasive spring constant calibration.

  14. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

    SciTech Connect

    Sader, John E.; Sanelli, Julian A.; Adamson, Brian D.; Bieske, Evan J.; Monty, Jason P.; Marusic, Ivan; Wei Xingzhan; Mulvaney, Paul; Crawford, Simon A.; Friend, James R.

    2012-10-15

    The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

  15. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.

    PubMed

    Killgore, Jason P; Tung, Ryan C; Hurley, Donna C

    2014-08-29

    Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties, such as contact resonance force microscopy, creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an atomic force microscope cantilever's vibrational modes, it is essential to understand how the vibrations of the U-shaped HT-AFM cantilever differ from those of a more traditional rectangular lever, for which analytical techniques are better developed. Here we show, with a combination of finite element analysis (FEA) and experiments, that the HT-AFM cantilever exhibits many more readily-excited vibrational modes over typical AFM frequencies compared to a rectangular cantilever. The arms of U-shaped HT-AFM cantilevers exhibit two distinct forms of flexural vibrations that differ depending on whether the two arms are vibrating in-phase or out-of-phase with one another. The in-phase vibrations are qualitatively similar to flexural vibrations in rectangular cantilevers and generally show larger sensitivity to surface stiffness changes than the out-of-phase vibrations. Vibration types can be identified from their frequency and by considering vibration amplitudes in the horizontal and vertical channels of the AFM at different laser spot positions on the cantilever. For identifying contact resonance vibrational modes, we also consider the sensitivity of the resonant frequencies to a change in applied force and hence to tip-sample contact stiffness. Finally, we assess how existing analytical models can be used to accurately predict contact stiffness from contact-resonance HT-AFM results. A simple two-parameter Euler-Bernoulli beam model provided good agreement with FEA for in-phase modes up to a contact stiffness 500 times the cantilever spring constant. By providing insight into cantilever vibrations and exploring the potential of current analysis techniques, our results lay the groundwork

  16. A direct micropipette-based calibration method for atomic force microscope cantilevers

    PubMed Central

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes. PMID:19566228

  17. Calibration of the lateral spring constant of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-10-01

    Atomic force microscope (AFM) is very useful in nano-scale force measurement. Lateral force is typically used in nanoscratch and surface friction measurement based on AFM. As one of the most important parameters to obtain lateral force, the lateral spring constant of AFM cantilever probe is of great significance and needs to be quantitative calibrated. Lateral torsion and lateral force of the cantilever are two parameters need to be measured in lateral spring constant calibration. In this article, we develop a calibration system and introduce a calibration method using an AFM head and an electromagnetic balance. An aluminium column with a known angel on top is placed on the weighing pan of the balance. The cantilever is precisely positioned in the AFM head, then approaches and bends on the aluminium column. During this procedure, the bending force and the lateral torsion of the cantilever are synchronously measured by the balance and an optical lever system, respectively. Then the lateral spring constant is calculated with a formula. By using this method, three kinds of rectangular cantilever are calibrated. The relative standard deviations of the calibration results are smaller than 2%.

  18. Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method

    SciTech Connect

    Tseytlin, Yakov M.

    2008-02-15

    Our previous study of the particle mass sensor has shown a large ratio (up to thousands) between the spring constants of a rectangular cantilever in higher mode vibration and at the static bending or natural mode vibration. This has been proven by us through the derived nodal point position equation. That solution is good for a cantilever with the free end in noncontact regime and the probe shifted from the end to an effective section and contacting a soft object. Our further research shows that the same nodal position equation with the proper frequency equations may be used for the same spring constant ratio estimation if the vibrating at higher mode cantilever's free end has a significant additional mass clamped to it or that end is in permanent contact with an elastic or hard measurand object (reference cantilever). However, in the latter case, the spring constant ratio is much smaller (in tens) than in other mentioned cases at equal higher (up to fourth) vibration modes. We also present the spring constant ratio for a vibrating at higher eigenmode V-shaped cantilever, which is now in wide use for atomic force microscopy. The received results on the spring constant ratio are in good (within a few percent) agreement with the theoretical and experimental data published by other researchers. The knowledge of a possible spring constant transformation is important for the proper calibration and use of an atomic force microscope with vibrating cantilever in the higher eigenmodes for measurement and imaging with enlarged resolution.

  19. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    NASA Astrophysics Data System (ADS)

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-01

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5-10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100-500 Hz for scan areas of several micrometers in size.

  20. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    SciTech Connect

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  1. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

    SciTech Connect

    Sader, John E.; Friend, James R.

    2015-05-15

    Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

  2. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

    PubMed Central

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-01-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson’s ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. PMID:26510769

  3. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    PubMed

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-01-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. PMID:26510769

  4. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson’s ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  5. Calibration of the effective spring constant of ultra-short cantilevers for a high-speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Song, Yun-Peng; Wu, Sen; Xu, Lin-Yan; Zhang, Jun-Ming; Dorantes-Gonzalez, Dante J.; Fu, Xing; Hu, Xiao-Dong

    2015-06-01

    Ultra-short cantilevers are a new type of cantilever designed for the next generation of high-speed atomic force microscope (HS-AFM). Ultra-short cantilevers have smaller dimensions and higher resonant frequency than conventional AFM cantilevers. Moreover, their geometry may also be different from the conventional beam-shape or V-shape. These changes increase the difficulty of determining the spring constant for ultra-short cantilevers, and hence limit the accuracy and precision of force measurement based on a HS-AFM. This paper presents an experimental method to calibrate the effective spring constant of ultra-short cantilevers. By using a home-made AFM head, the cantilever is bent against an electromagnetic compensation balance under servo control. Meanwhile the bending force and the cantilever deflection are synchronously measured by the balance and the optical lever in the AFM head, respectively. Then the effective spring constant is simply determined as the ratio of the force to the corresponding deflection. Four ultra-short trapezoid shape cantilevers were calibrated using this method. A quantitative uncertainty analysis showed that the combined relative standard uncertainty of the calibration result is less than 2%, which is better than the uncertainty of any previously reported techniques.

  6. Paramagnetic and ferromagnetic resonance imaging with a tip-on-cantilever magnetic resonance force microscope

    NASA Astrophysics Data System (ADS)

    Wago, K.; Botkin, D.; Yannoni, C. S.; Rugar, D.

    1998-05-01

    A magnetic resonance force microscope with a "tip-on-cantilever" configuration was used to compare imaging characteristics of paramagnetic and ferromagnetic samples. Three-dimensional electron paramagnetic resonance (EPR) imaging of diphenylpicrylhydrazil (DPPH) particles was accomplished by scanning the sample in two dimensions while stepping an external field. The EPR force map showed broad response reflecting the size and shape of the sample, allowing a three-dimensional real-space magnetization image to be successfully reconstructed. In contrast to the EPR case, ferromagnetic resonance imaging of a micron-scale yttrium iron garnet sample showed no significant line broadening despite the strong field gradient (˜10 G/μm). Two-dimensional force maps revealed spatial dependence of magnetostatic and magnetoelastic modes.

  7. Topography imaging with a heated atomic force microscope cantilever in tapping mode

    SciTech Connect

    Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P.

    2007-04-15

    This article describes tapping mode atomic force microscopy (AFM) using a heated AFM cantilever. The electrical and thermal responses of the cantilever were investigated while the cantilever oscillated in free space or was in intermittent contact with a surface. The cantilever oscillates at its mechanical resonant frequency, 70.36 kHz, which is much faster than its thermal time constant of 300 {mu}s, and so the cantilever operates in thermal steady state. The thermal impedance between the cantilever heater and the sample was measured through the cantilever temperature signal. Topographical imaging was performed on silicon calibration gratings of height 20 and 100 nm. The obtained topography sensitivity is as high as 200 {mu}V/nm and the resolution is as good as 0.5 nm/Hz{sup 1/2}, depending on the cantilever power. The cantilever heating power ranges 0-7 mW, which corresponds to a temperature range of 25-700 deg. C. The imaging was performed entirely using the cantilever thermal signal and no laser or other optics was required. As in conventional AFM, the tapping mode operation demonstrated here can suppress imaging artifacts and enable imaging of soft samples.

  8. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    PubMed

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids. PMID:26402914

  9. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  10. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied – in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry – neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  11. On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids

    SciTech Connect

    Kiracofe, Daniel; Raman, Arvind

    2010-02-15

    The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated by measuring the vibrations of such microcantilevers in air and water using a scanning laser Doppler vibrometer. It is found that for rectangular tipless microcantilevers, the measured fundamental and higher eigenmodes and their equivalent stiffnesses are nearly identical in air and in water. However, for microcantilevers with a tip mass or for picket shaped cantilevers, there is a marked difference in the second (and higher) eigenmode shapes between air and water that leads to a large decrease in their modal stiffness in water as compared to air as well as a decrease in their optical lever sensitivity. These results are explained in terms of hydrodynamic interactions of microcantilevers with nonuniform mass distribution. The results clearly demonstrate that tip mass and hydrodynamic loading must be taken into account in stiffness calibration and optical lever sensitivity calibration while using higher-order eigenmodes in dynamic AFM.

  12. A pressure gauge based on gas density measurement from analysis of the thermal noise of an atomic force microscope cantilever

    SciTech Connect

    Seo, Dongjin; Ducker, William A.; Paul, Mark R.

    2012-05-15

    We describe a gas-density gauge based on the analysis of the thermally-driven fluctuations of an atomic force microscope (AFM) cantilever. The fluctuations are modeled as a ring-down of a simple harmonic oscillator, which allows fitting of the resonance frequency and damping of the cantilever, which in turn yields the gas density. The pressure is obtained from the density using the known equation of state. In the range 10-220 kPa, the pressure readings from the cantilever gauge deviate by an average of only about 5% from pressure readings on a commercial gauge. The theoretical description we use to determine the pressure from the cantilever motion is based upon the continuum hypothesis, which sets a minimum pressure for our analysis. It is anticipated that the cantilever gauge could be extended to measure lower pressures given a molecular theoretical description. Alternatively, the gauge could be calibrated for use in the non-continuum range. Our measurement technique is similar to previous AFM cantilever measurements, but the analysis produces improved accuracy.

  13. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.

    PubMed

    Slattery, Ashley D; Blanch, Adam J; Quinton, Jamie S; Gibson, Christopher T

    2013-08-01

    calibrate the cantilever spring constant using the thermal noise method, allowing complete force calibration to be accurately performed without tip-sample contact. PMID:23685172

  14. Viscoelastic properties of single polysaccharide molecules determined by analysis of thermally driven oscillations of an atomic force microscope cantilever.

    PubMed

    Kawakami, Masaru; Byrne, Katherine; Khatri, Bhavin; McLeish, Tom C B; Radford, Sheena E; Smith, D Alastair

    2004-10-12

    We report on single molecule measurements of the viscoelastic properties of the polysaccharide dextran using a new approach which involves acquiring the power spectral density of the thermal noise of an atomic force microscope cantilever while holding the single molecule of interest under force-clamp conditions. The attractiveness of this approach when compared with techniques which use forced oscillations under constant loading rate conditions is that it is a near-equilibrium measure of mechanical response which provides a more relevant probe of thermally driven biomolecular dynamics. Using a simple harmonic oscillator model of the cantilever-molecule system and by subtracting the response of the free cantilever taking into account hydrodynamic effects, the effective damping zetamol and elastic constant kmol of a single molecule are obtained. The molecular elasticity measured by this new technique shows a dependence on applied force that reflects the chair-boat conformational transition of the pyranose rings of the dextran molecule which is in good agreement with values obtained directly from the gradient of a conventional constant loading rate force-extension curve. The molecular damping is also seen to follow a nontrivial dependence on loading which we suggest indicates that it is internal friction and not work done on the solvent that is the dominant dissipative process. PMID:15461521

  15. Temperature and non-linear response of cantilever-type mechanical oscillators used in atomic force microscopes with interferometric detection

    SciTech Connect

    Fläschner, G.; Ruschmeier, K.; Schwarz, A. Wiesendanger, R.; Bakhtiari, M. R.; Thorwart, M.

    2015-03-23

    The sensitivity of atomic force microscopes is fundamentally limited by the cantilever temperature, which can be, in principle, determined by measuring its thermal spectrum and applying the equipartition theorem. However, the mechanical response can be affected by the light field inside the cavity of a Fabry-Perot interferometer due to light absorption, radiation pressure, photothermal forces, and laser noise. By evaluating the optomechanical Hamiltonian, we are able to explain the peculiar distance dependence of the mechanical quality factor as well as the appearance of thermal spectra with symmetrical Lorentzian as well as asymmetrical Fano line shapes. Our results can be applied to any type of mechanical oscillator in an interferometer-based detection system.

  16. Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation

    NASA Astrophysics Data System (ADS)

    Weafer, P. P.; McGarry, J. P.; van Es, M. H.; Kilpatrick, J. I.; Ronan, W.; Nolan, D. R.; Jarvis, S. P.

    2012-09-01

    Atomic force microscopy (AFM) is widely used in the study of both morphology and mechanical properties of living cells under physiologically relevant conditions. However, quantitative experiments on timescales of minutes to hours are generally limited by thermal drift in the instrument, particularly in the vertical (z) direction. In addition, we demonstrate the necessity to remove all air-liquid interfaces within the system for measurements in liquid environments, which may otherwise result in perturbations in the measured deflection. These effects severely limit the use of AFM as a practical tool for the study of long-term cell behavior, where precise knowledge of the tip-sample distance is a crucial requirement. Here we present a readily implementable, cost effective method of minimizing z-drift and liquid instabilities by utilizing active temperature control combined with a customized fluid cell system. Long-term whole cell mechanical measurements were performed using this stabilized AFM by attaching a large sphere to a cantilever in order to approximate a parallel plate system. An extensive examination of the effects of sphere attachment on AFM data is presented. Profiling of cantilever bending during substrate indentation revealed that the optical lever assumption of free ended cantilevering is inappropriate when sphere constraining occurs, which applies an additional torque to the cantilevers "free" end. Here we present the steps required to accurately determine force-indentation measurements for such a scenario. Combining these readily implementable modifications, we demonstrate the ability to investigate long-term whole cell mechanics by performing strain controlled cyclic deformation of single osteoblasts.

  17. Viscoelastic measurements of single molecules on a millisecond time scale by magnetically driven oscillation of an atomic force microscope cantilever.

    PubMed

    Kawakami, Masaru; Byrne, Katherine; Khatri, Bhavin S; Mcleish, Tom C B; Radford, Sheena E; Smith, D Alastair

    2005-05-10

    The dynamical nature of biomolecular systems means that knowledge of their viscoelastic behavior is important in fully understanding function. The linear viscoelastic response can be derived from an analysis of Brownian motion. However, this is a slow measurement and technically demanding for many molecular systems of interest. To address this issue, we have developed a simple method for measuring the full linear viscoelastic response of single molecules based on magnetically driven oscillations of an atomic force microscope cantilever. The cantilever oscillation frequency is periodically swept through the system resonance in less than 200 ms allowing the power spectrum to be obtained rapidly and analyzed with a suitable model. The technique has been evaluated using dextran, a polysaccharide commonly used as a test system for single molecule mechanical manipulation experiments. The monomer stiffness and friction constants were compared with those derived from other methods. Excellent agreement is obtained indicating that the new method accurately and, most importantly, rapidly provides the viscoelastic response of a single molecule between the tip and substrate. The method will be a useful tool for studying systems that change their structure and dynamic response on a time scale of 100-200 ms, such as protein folding and unfolding under applied force. PMID:16032901

  18. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    PubMed

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position. PMID:26324257

  19. Laser-induced thermal expansion of a scanning tunneling microscope tip measured with an atomic force microscope cantilever

    NASA Astrophysics Data System (ADS)

    Huber, R.; Koch, M.; Feldmann, J.

    1998-10-01

    We investigate the transient thermal expansion of a scanning tunneling microscope tip after excitation with intense femtosecond laser pulses. The expansion dynamics are measured electrically by monitoring the time-resolved tunneling current and mechanically by use of an atomic force microscope. The tip expansion reaches values as high as 15 nm and exceeds the typical working distance of a scanning tunneling microscope by far. This results in a mechanical contact between tunneling tip and surface leading to surface modifications on a nanometer scale. Our findings clarify the mechanism of the recently proposed focusing of laser radiation in the near field of a tip technique [J. Jersch and K. Dickmann, Appl. Phys. Lett. 68, 868 (1996)] for nanostructuring.

  20. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  1. Low temperature scanning force microscopy using piezoresistive cantilevers

    NASA Astrophysics Data System (ADS)

    Meiser, P.; Koblischka, M. R.; Hartmann, U.

    2015-08-01

    A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

  2. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  3. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  4. Exploiting cantilever curvature for noise reduction in atomic force microscopy.

    PubMed

    Labuda, Aleksander; Grütter, Peter H

    2011-01-01

    Optical beam deflection is a widely used method for detecting the deflection of atomic force microscope (AFM) cantilevers. This paper presents a first order derivation for the angular detection noise density which determines the lower limit for deflection sensing. Surprisingly, the cantilever radius of curvature, commonly not considered, plays a crucial role and can be exploited to decrease angular detection noise. We demonstrate a reduction in angular detection shot noise of more than an order of magnitude on a home-built AFM with a commercial 450 μm long cantilever by exploiting the optical properties of the cantilever curvature caused by the reflective gold coating. Lastly, we demonstrate how cantilever curvature can be responsible for up to 45% of the variability in the measured sensitivity of cantilevers on commercially available AFMs. PMID:21280834

  5. Cantilevers orthodontics forces measured by fiber sensors

    NASA Astrophysics Data System (ADS)

    Schneider, Neblyssa; Milczewski, Maura S.; de Oliveira, Valmir; Guariza Filho, Odilon; Lopes, Stephani C. P. S.; Kalinowski, Hypolito J.

    2015-09-01

    Fibers Bragg Gratings were used to evaluate the transmission of the forces generates by orthodontic mechanic based one and two cantilevers used to move molars to the upright position. The results showed levels forces of approximately 0,14N near to the root of the molar with one and two cantilevers.

  6. Prototype cantilevers for quantitative lateral force microscopy

    SciTech Connect

    Reitsma, Mark G.; Gates, Richard S.; Friedman, Lawrence H.; Cook, Robert F.

    2011-09-15

    Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

  7. In-situ piezoresponse force microscopy cantilever mode shape profiling

    SciTech Connect

    Proksch, R.

    2015-08-21

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  8. Piezoresistive cantilever force-clamp system

    SciTech Connect

    Park, Sung-Jin; Petzold, Bryan C.; Pruitt, Beth L.; Goodman, Miriam B.

    2011-04-15

    We present a microelectromechanical device-based tool, namely, a force-clamp system that sets or ''clamps'' the scaled force and can apply designed loading profiles (e.g., constant, sinusoidal) of a desired magnitude. The system implements a piezoresistive cantilever as a force sensor and the built-in capacitive sensor of a piezoelectric actuator as a displacement sensor, such that sample indentation depth can be directly calculated from the force and displacement signals. A programmable real-time controller operating at 100 kHz feedback calculates the driving voltage of the actuator. The system has two distinct modes: a force-clamp mode that controls the force applied to a sample and a displacement-clamp mode that controls the moving distance of the actuator. We demonstrate that the system has a large dynamic range (sub-nN up to tens of {mu}N force and nm up to tens of {mu}m displacement) in both air and water, and excellent dynamic response (fast response time, <2 ms and large bandwidth, 1 Hz up to 1 kHz). In addition, the system has been specifically designed to be integrated with other instruments such as a microscope with patch-clamp electronics. We demonstrate the capabilities of the system by using it to calibrate the stiffness and sensitivity of an electrostatic actuator and to measure the mechanics of a living, freely moving Caenorhabditis elegans nematode.

  9. Piezoresistive cantilever force-clamp system

    PubMed Central

    Park, Sung-Jin; Petzold, Bryan C.; Goodman, Miriam B.; Pruitt, Beth L.

    2011-01-01

    We present a microelectromechanical device-based tool, namely, a force-clamp system that sets or “clamps” the scaled force and can apply designed loading profiles (e.g., constant, sinusoidal) of a desired magnitude. The system implements a piezoresistive cantilever as a force sensor and the built-in capacitive sensor of a piezoelectric actuator as a displacement sensor, such that sample indentation depth can be directly calculated from the force and displacement signals. A programmable real-time controller operating at 100 kHz feedback calculates the driving voltage of the actuator. The system has two distinct modes: a force-clamp mode that controls the force applied to a sample and a displacement-clamp mode that controls the moving distance of the actuator. We demonstrate that the system has a large dynamic range (sub-nN up to tens of μN force and nm up to tens of μm displacement) in both air and water, and excellent dynamic response (fast response time, <2 ms and large bandwidth, 1 Hz up to 1 kHz). In addition, the system has been specifically designed to be integrated with other instruments such as a microscope with patch-clamp electronics. We demonstrate the capabilities of the system by using it to calibrate the stiffness and sensitivity of an electrostatic actuator and to measure the mechanics of a living, freely moving Caenorhabditis elegans nematode. PMID:21529009

  10. Resonance response of scanning force microscopy cantilevers

    SciTech Connect

    Chen, G.Y.; Warmack, R.J.; Thundat, T.; Allison, D.P. ); Huang, A. )

    1994-08-01

    A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor [ital Q]. Helium has the lowest viscosity, resulting in the highest [ital Q], and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.

  11. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  12. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  13. Self-driving capacitive cantilevers for high-frequency atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Brown, Keith A.; Yang, Benjamin H.; Westervelt, R. M.

    2012-01-01

    We demonstrate a simple way to actuate an atomic force microscope cantilever at high frequencies by electrically driving a thin-film capacitor on its surface. Capacitive driving directly actuates the vibrational mode of the cantilever, removing the effects of unwanted mechanical modes present in conventional driving systems and removing the need for a drive piezoelectric. Practical vibration amplitudes are attainable at drive voltages <5 V. We capacitively drive the first mechanical resonance of a tapping mode cantilever (243 kHz) and a high-frequency cantilever (1.5 MHz) with vibration amplitudes in agreement with our model of capacitive driving.

  14. Improved atomic force microscopy cantilever performance by partial reflective coating.

    PubMed

    Schumacher, Zeno; Miyahara, Yoichi; Aeschimann, Laure; Grütter, Peter

    2015-01-01

    Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. PMID:26199849

  15. Finite element modeling of atomic force microscopy cantilever dynamics during video rate imaging

    SciTech Connect

    Howard-Knight, J. P.; Hobbs, J. K.

    2011-04-01

    A dynamic finite element model has been constructed to simulate the behavior of low spring constant atomic force microscope (AFM) cantilevers used for imaging at high speed without active feedback as in VideoAFM. The model is tested against experimental data collected at 20 frame/s and good agreement is found. The complex dynamics of the cantilever, consisting of traveling waves coming from the tip sample interaction, reflecting off the cantilever-substrate junction, and interfering with new waves created at the tip, are revealed. The construction of the image from this resulting nonequilibrium cantilever deflection is also examined. Transient tip-sample forces are found to reach values up to 260 nN on a calibration grid sample, and the maximum forces do not always correspond to the position of steepest features as a result of energy stored in the cantilever.

  16. Resonant difference-frequency atomic force ultrasonic microscope

    NASA Technical Reports Server (NTRS)

    Cantrell, John H. (Inventor); Cantrell, Sean A. (Inventor)

    2010-01-01

    A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.

  17. Macroscopic model of scanning force microscope

    DOEpatents

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  18. Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

    NASA Astrophysics Data System (ADS)

    Hoof, Sebastian; Nand Gosvami, Nitya; Hoogenboom, Bart W.

    2012-12-01

    Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here, we show that a high-quality resonance (Q >20) can be achieved in aqueous solution by attaching a microgram-bead at the end of the nanogram-cantilever. The resulting increase in cantilever mass causes the resonance frequency to drop significantly. However, the force sensitivity—as expressed via the minimum detectable force gradient—is hardly affected, because of the enhanced quality factor. Through the enhancement of the quality factor, the attached bead also reduces the relative importance of noise in the deflection detector. It can thus yield an improved signal-to-noise ratio when this detector noise is significant. We describe and analyze these effects for a set-up that includes magnetic actuation of the cantilevers and that can be easily implemented in any AFM system that is compatible with an inverted optical microscope.

  19. Atomic Force Microscope

    SciTech Connect

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  20. The poor man's scanning force microscope

    NASA Astrophysics Data System (ADS)

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2002-03-01

    The Macroscope (Zypman F R and Guerra-Vela C 2001 Eur. J. Phys. 22 17-30), an educational large-scale version of a scanning force microscope's cantilever-tip system, is used in the presence of nonlinear forces. This paper presents quantitative experimental evidence confirming the validity of the beam model (BM) (Eppel S J, Todd B A and Zypman F R 2000 Materials Issues and Modeling for Device Nanofabrication ed L Merhari et al (Pittsburgh, PA: Materials Research Society) pp 584, 189) as a proper reconstruction algorithm. As a teaching laboratory experiment, the force measurements are first done directly with a variety of dynamometer-like setups. Subsequently, the measurements are performed indirectly with the Macroscope from the cantilever resonant frequency shifts and the BM algorithm. Two central results of this work lie in its ability to compare forces obtained by traditional algorithms with known forces, and to illustrate in a hands-on fashion the principles behind the working of a scanning force microscope.

  1. Cantilevers and tips for atomic force microscopy.

    PubMed

    Tortonese, M

    1997-01-01

    The cantilever and the tip are at the centerpiece of the AFM. Properties such as the cantilever stiffness and resonant frequency, tip shape and sharpness, and material characteristics determine the mode of operation of the AFM and the type of experiments and measurements that can be performed. The possibility of batch fabricating cantilevers has permitted the fabrication and characterization of specialized tips for a variety of experiments. We believe that the use of new materials and tip shapes will allow new applications for the AFM in the future. PMID:9086369

  2. Force spectroscopy with a large dynamic range using small cantilevers and an array detector

    NASA Astrophysics Data System (ADS)

    Schäffer, Tilman E.

    2002-04-01

    The important characteristics of a detector for force spectroscopy measurements are sensitivity, linearity and dynamic range. The commonly used two-segment detector that measures the position of a light beam reflected from the force-sensing cantilever in an atomic force microscope becomes nonlinear when the beam shifts significantly onto one of the segments. For a detection setup optimized for high sensitivity, such as needed for the use with small cantilevers, it is shown both experimentally and theoretically that the dynamic range extends to an upper detection limit of only about 115 nm in cantilever deflection if <10% nonlinearity is required. A detector is presented that circumvents that limitation. This detector is based on a linear arrangement of multiple photodiode segments that are read out individually. With such an array detector, the irradiance distribution of the reflected beam is measured. The reflected beam not only shifts in position but also deforms when the cantilever deflects because the bent cantilever acts as a curved mirror. The mean of the distribution, however, is a linear function of cantilever deflection in both theory and experiment. An array detector is consequently well suited for force measurements for which both high sensitivity and a large dynamic range are required.

  3. Atomic Force Microscope Mediated Chromatography

    NASA Technical Reports Server (NTRS)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  4. Improved single molecule force spectroscopy using micromachined cantilevers.

    PubMed

    Bull, Matthew S; Sullan, Ruby May A; Li, Hongbin; Perkins, Thomas T

    2014-05-27

    Enhancing the short-term force precision of atomic force microscopy (AFM) while maintaining excellent long-term force stability would result in improved performance across multiple AFM modalities, including single molecule force spectroscopy (SMFS). SMFS is a powerful method to probe the nanometer-scale dynamics and energetics of biomolecules (DNA, RNA, and proteins). The folding and unfolding rates of such macromolecules are sensitive to sub-pN changes in force. Recently, we demonstrated sub-pN stability over a broad bandwidth (Δf = 0.01-16 Hz) by removing the gold coating from a 100 μm long cantilever. However, this stability came at the cost of increased short-term force noise, decreased temporal response, and poor sensitivity. Here, we avoided these compromises while retaining excellent force stability by modifying a short (L = 40 μm) cantilever with a focused ion beam. Our process led to a ∼10-fold reduction in both a cantilever's stiffness and its hydrodynamic drag near a surface. We also preserved the benefits of a highly reflective cantilever while mitigating gold-coating induced long-term drift. As a result, we extended AFM's sub-pN bandwidth by a factor of ∼50 to span five decades of bandwidth (Δf ≈ 0.01-1000 Hz). Measurements of mechanically stretching individual proteins showed improved force precision coupled with state-of-the-art force stability and no significant loss in temporal resolution compared to the stiffer, unmodified cantilever. Finally, these cantilevers were robust and were reused for SFMS over multiple days. Hence, we expect these responsive, yet stable, cantilevers to broadly benefit diverse AFM-based studies. PMID:24670198

  5. Atomic Force Microscope Operation

    NASA Technical Reports Server (NTRS)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for animation (large file)

    This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The AFM is used to image the smallest Martian particles using a very sharp tip at the end of one of eight beams.

    The beam of the AFM is set into vibration and brought up to the surface of a micromachined silicon substrate. The substrate has etched in it a series of pits, 5 micrometers deep, designed to hold the Martian dust particles.

    The microscope then maps the shape of particles in three dimensions by scanning them with the tip.

    At the end of the animation is a 3D representation of the AFM image of a particle that was part of a sample informally called 'Sorceress.' The sample was delivered to the AFM on the 38th Martian day, or sol, of the mission (July 2, 2008).

    The image shows four round pits, only 5 microns in depth, that were micromachined into the silicon substrate.

    A Martian particle only one micrometer, or one millionth of a meter, across is held in the upper left pit.

    The rounded particle shown at the highest magnification ever seen from another world is a particle of the dust that cloaks Mars. Such dust particles color the Martian sky pink, feed storms that regularly envelop the planet and produce Mars' distinctive red soil.

    The AFM was developed by a Swiss-led consortium, with Imperial College London producing the silicon substrate that holds sampled particles.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  6. Measuring energies with an Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Langer, J.; Díez-Pérez, I.; Sanz, F.; Fraxedas, J.

    2006-04-01

    The elastic and plastic response of ordered inorganic, organic and biological materials involving nanometer-scale volumes in the nano- and low micronewton force range can be characterized by means of an Atomic Force Microscope (AFM) using ultrasharp cantilever tips with radius R typically below 10 nm. Because the plastic onset can be easily identified, the maximal accumulated elastic energy can be directly determined from the force curves (force F vs. penetration δ curves), thus giving a realistic estimate of the characteristic energies of the materials. We illustrate the ability of AFMs to determine such energies with the case example of the molecular organic metal TTF-TCNQ (TTF = tetrathiafulvalene, TCNQ = tetracyanoquinodimethane), where the enthalpy of sublimation is obtained.

  7. Forced Vibrations of a Cantilever Beam

    ERIC Educational Resources Information Center

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-01-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is "downwards", i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping…

  8. Vertical electrostatic force in MEMS cantilever IR sensor

    NASA Astrophysics Data System (ADS)

    Rezadad, Imen; Boroumand Azad, Javaneh; Smith, Evan M.; Alhasan, Ammar; Peale, Robert E.

    2014-06-01

    A MEMS cantilever IR detector that repetitively lifts from the surface under the influence of a saw-tooth electrostatic force, where the contact duty cycle is a measure of the absorbed IR radiation, is analyzed. The design is comprised of three parallel conducting plates. Fixed buried and surface plates are held at opposite potential. A moveable cantilever is biased the same as the surface plate. Calculations based on energy methods with position-dependent capacity and electrostatic induction coefficients demonstrate the upward sign of the force on the cantilever and determine the force magnitude. 2D finite element method calculations of the local fields confirm the sign of the force and determine its distribution across the cantilever. The upward force is maximized when the surface plate is slightly larger than the other two. The electrostatic repulsion is compared with Casimir sticking force to determine the maximum useful contact area. MEMS devices were fabricated and the vertical displacement of the cantilever was observed in a number of experiments. The approach may be applied also to MEMS actuators and micromirrors.

  9. Nanoscale thermal processing using a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Nelson, Brent A.

    This dissertation aims to advance the current state of use of silicon atomic force microscope (AFM) cantilevers with integrated heaters. To this end, the research consists of two primary thrusts---demonstrating new applications for the cantilevers, and advancing the current state of understanding of their thermal and mechanical behavior to enable further applications. Among new applications, two are described. In the first application, the cantilevers are used for nanoscale material deposition, using heat to modulate the delivery of material from the nanoscale tip. In the second application, the cantilever performs thermal analysis with nanoscale spatial resolution, enabling thermal characterization of near surface and composite interphase regions that cannot be measured with bulk analysis techniques. The second thrust of the research seeks to address fundamental questions concerning the precision use of heated cantilevers. Efforts to this end include characterizing the mechanical, electrical, and thermal behavior of the cantilevers, and optimizing calibration methodology. A technique is developed for calibrating the cantilever spring constant while operating at elevated temperature. Finally, an analytical model is developed for the heat flow in the cantilever tip and relevant dimensionless numbers that govern the relative importance of the various components of the thermal environment are identified. The dimensionless numbers permit exploration of the sensitivity of the tip-substrate interface temperature to the environmental conditions.

  10. Intrinsic dissipation in atomic force microscopy cantilevers.

    PubMed

    Zypman, Fredy

    2011-07-01

    In this paper we build a practical modification to the standard Euler-Bernoulli equation for flexural modes of cantilever vibrations most relevant for operation of AFM in high vacuum conditions. This is done by the study of a new internal dissipation term into the Euler-Bernoulli equation. This term remains valid in ultra-high vacuum, and becomes particularly relevant when viscous dissipation with the fluid environment becomes negligible. We derive a compact explicit equation for the quality factor versus pressure for all the flexural modes. This expression is used to compare with corresponding extant high vacuum experiments. We demonstrate that a single internal dissipation parameter and a single viscosity parameter provide enough information to reproduce the first three experimental flexural resonances at all pressures. The new term introduced here has a mesoscopic origin in the relative motion between adjacent layers in the cantilever. PMID:21741914

  11. Lead zirconate titanate cantilever for noncontact atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Miyahara, Y.; Fujii, T.; Watanabe, S.; Tonoli, A.; Carabelli, S.; Yamada, H.; Bleuler, H.

    1999-02-01

    Noncontact atomic force microscopy with frequency modulation detection is a promising technique for surface observation with true atomic resolution. The piezoelectric material itself can be an actuator and sensor of the oscillating probe simultaneously, without the need for additional electro-mechanical transducers or other measurement systems. A vertical resolution of 0.01 nm rms has been achieved using a microfabricated cantilever with lead zirconate titanate thin film in noncontact mode frequency modulation detection. The cantilever also has a sharpened pyramidal stylus with a radius of about 10 nm for noncontact atomic force microscopy.

  12. Compact cantilever force probe for plasma pressure measurements

    SciTech Connect

    Nedzelskiy, I. S.; Silva, C.; Fernandes, H.; Duarte, P.; Varandas, C. A. F.

    2007-12-15

    A simple, compact cantilever force probe (CFP) has been developed for plasma pressure measurements. It is based on the pull-in phenomenon well known in microelectromechanical-system electrostatic actuators. The probe consists of a thin (25 {mu}m) titanium foil cantilever (38 mm of length and 14 mm of width) and a fixed electrode separated by a 0.75 mm gap. The probe is shielded by brass box and enclosed into boron nitride housing with a 9 mm diameter window for exposing part of cantilever surface to the plasma. When the voltage is applied between the cantilever and the electrode, an attractive electrostatic force is counterbalanced by cantilever restoring spring force. At some threshold (pull-in) voltage the system becomes unstable and the cantilever abruptly pulls toward the fixed electrode until breakdown occurs between them. The threshold voltage is sensitive to an additional externally applied force, while a simple detection of breakdown occurrence can be used to measure that threshold voltage value. The sensitivity to externally applied forces obtained during calibration is 0.28 V/{mu}N (17.8 V/Pa for pressure). However, the resolution of the measurements is {+-}0.014 mN ({+-}0.22 Pa) due to the statistical scattering in measured pull-in voltages. The diagnostic temporal resolution is {approx}10 ms, being determined by the dynamics of pull-in process. The probe has been tested in the tokamak ISTTOK edge plasma, and a plasma force of {approx}0.07 mN (plasma pressure {approx}1.1 Pa) has been obtained near the leading edge of the limiter. This value is in a reasonable agreement with the estimations using local plasma parameters measured by electrical probes. The use of the described CFP is limited by a heat flux of Q{approx}10{sup 6} W/m{sup 2} due to uncontrollable rise of the cantilever temperature ({delta}T{approx}20 deg. C) during CFP response time.

  13. Shear force microscopy using piezoresistive cantilevers in surface metrology

    NASA Astrophysics Data System (ADS)

    Gotszalk, Teodor; Kopiec, Daniel; Sierakowski, Andrzej; Janus, Paweł; Grabiec, Piotr; Rangelow, Ivo W.

    2014-09-01

    In this article we describe application of piezoresistive cantilevers in surface investigations carried out with the use of shear force microscopy (ShFM). The novel piezoresistive cantilevers integrate a Wheatstone piezoresistive bridge was used to detect the cantilever deflection, thermal deflection detector and planar tip protruding out of the spring beam. Because the planar tip deflection can be detected and controlled electronically the described technology is very flexible and can be applied in many surface investigations. In this article we will present operation theory of the described solution, experimental setup, methods for calibration of the tip deflection detection and actuation The analysis will be illustrated with example results of topography measurements performed using the described technology.

  14. Contractile cell forces deform macroscopic cantilevers and quantify biomaterial performance.

    PubMed

    Allenstein, U; Mayr, S G; Zink, M

    2015-07-01

    Cells require adhesion to survive, proliferate and migrate, as well as for wound healing and many other functions. The strength of contractile cell forces on an underlying surface is a highly relevant quantity to measure the affinity of cells to a rigid surface with and without coating. Here we show with experimental and theoretical studies that these forces create surface stresses that are sufficient to induce measurable bending of macroscopic cantilevers. Since contractile forces are linked to the formation of focal contacts, results give information on adhesion promoting qualities and allow a comparison of very diverse materials. In exemplary studies, in vitro fibroblast adhesion on the magnetic shape memory alloy Fe-Pd and on the l-lysine derived plasma-functionalized polymer PPLL was determined. We show that cells on Fe-Pd are able to induce surface stresses three times as high as on pure titanium cantilevers. A further increase was observed for PPLL, where the contractile forces are four times higher than on the titanium reference. In addition, we performed finite element simulations on the beam bending to back up the calculation of contractile forces from cantilever bending under non-homogenous surface stress. Our findings consolidate the role of contractile forces as a meaningful measure of biomaterial performance. PMID:26027952

  15. Precise and direct method for the measurement of the torsion spring constant of the atomic force microscopy cantilevers

    SciTech Connect

    Jarząbek, D. M.

    2015-01-15

    A direct method for the evaluation of the torsional spring constants of the atomic force microscope cantilevers is presented in this paper. The method uses a nanoindenter to apply forces at the long axis of the cantilever and in the certain distance from it. The torque vs torsion relation is then evaluated by the comparison of the results of the indentations experiments at different positions on the cantilever. Next, this relation is used for the precise determination of the torsional spring constant of the cantilever. The statistical analysis shows that the standard deviation of the calibration measurements is equal to approximately 1%. Furthermore, a simple method for calibration of the photodetector’s lateral response is proposed. The overall procedure of the lateral calibration constant determination has the accuracy approximately equal to 10%.

  16. Self-sensing piezoresistive cantilever and its magnetic force microscopy applications.

    PubMed

    Takahashi, Hiroshi; Ando, Kazunori; Shirakawabe, Yoshiharu

    2002-05-01

    A newly developed Si self-sensing piezoresistive cantilever is presented. Si piezoresistive cantilevers for scanning microscopy are fabricated by Si micro-machining technique. The sensitivity of the piezoresistive cantilever is comparable to the current laser detecting system. Topographic images are successfully obtained with the piezoresistive cantilever and some comparisons are made with the laser detecting system. Furthermore, the magnetic film (Co-Cr-Pt) is coated on the tip of the piezoresistive cantilever for magnetic force microscopy (MFM) application. The magnetic images are successfully obtained with the self-sensing MFM piezoresistive cantilever. The self-sensing piezoresistive cantilevers have been successfully applied in scanning probe microscopy and MFM. PMID:12211485

  17. Coaxial atomic force microscope tweezers

    NASA Astrophysics Data System (ADS)

    Brown, K. A.; Aguilar, J. A.; Westervelt, R. M.

    2010-03-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  18. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers

    SciTech Connect

    Grutzik, Scott J.; Zehnder, Alan T.; Gates, Richard S.; Gerbig, Yvonne B.; Smith, Douglas T.; Cook, Robert F.

    2013-11-15

    There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is required. In most cases, the forces of interest are very small, thus compliant cantilevers are used. A number of methods have been developed that are well suited to measuring low stiffness values. However, in some cases a cantilever with much greater stiffness is required. Thus, a direct, traceable method for calibrating very stiff (approximately 200 N/m) cantilevers is presented here. The method uses an instrumented and calibrated nanoindenter to determine the stiffness of a reference cantilever. This reference cantilever is then used to measure the stiffness of a number of AFM test cantilevers. This method is shown to have much smaller uncertainty than previously proposed methods. An example application to fracture testing of nanoscale silicon beam specimens is included.

  19. Viscous drag measurements utilizing microfabricated cantilevers

    SciTech Connect

    Oden, P.I.; Chen, G.Y.; Steele, R.A.; Warmack, R.J.; Thundat, T.

    1996-06-01

    The influence of viscous drag forces on cantilevers is investigated using standard atomic force microscope (AFM) cantilevers. Viscosity effects on several geometrically different cantilevers manifest themselves as variations in resonance frequencies, quality factors, and cantilever response amplitudes. With this novel measurement, a single cantilever can be used to measure viscosities ranging from {eta}=10{sup {minus}2} to 10{sup 2} g/cms. {copyright} {ital 1996 American Institute of Physics.}

  20. Laser Actuation of Cantilevers for Picometre Amplitude Dynamic Force Microscopy

    PubMed Central

    Evans, Drew R.; Tayati, Ponlawat; An, Hongjie; Lam, Ping Koy; Craig, Vincent S. J.; Senden, Tim J.

    2014-01-01

    As nanoscale and molecular devices become reality, the ability to probe materials on these scales is increasing in importance. To address this, we have developed a dynamic force microscopy technique where the flexure of the microcantilever is excited using an intensity modulated laser beam to achieve modulation on the picoscale. The flexure arises from thermally induced bending through differential expansion and the conservation of momentum when the photons are reflected and absorbed by the cantilever. In this study, we investigated the photothermal and photon pressure responses of monolithic and layered cantilevers using a modulated laser in air and immersed in water. The developed photon actuation technique is applied to the stretching of single polymer chains. PMID:24993548

  1. Laser actuation of cantilevers for picometre amplitude dynamic force microscopy.

    PubMed

    Evans, Drew R; Tayati, Ponlawat; An, Hongjie; Lam, Ping Koy; Craig, Vincent S J; Senden, Tim J

    2014-01-01

    As nanoscale and molecular devices become reality, the ability to probe materials on these scales is increasing in importance. To address this, we have developed a dynamic force microscopy technique where the flexure of the microcantilever is excited using an intensity modulated laser beam to achieve modulation on the picoscale. The flexure arises from thermally induced bending through differential expansion and the conservation of momentum when the photons are reflected and absorbed by the cantilever. In this study, we investigated the photothermal and photon pressure responses of monolithic and layered cantilevers using a modulated laser in air and immersed in water. The developed photon actuation technique is applied to the stretching of single polymer chains. PMID:24993548

  2. Correction of the viscous drag induced errors in macromolecular manipulation experiments using atomic force microscope.

    PubMed

    Liu, Runcong; Roman, Marisa; Yang, Guoliang

    2010-06-01

    We describe a method to correct the errors induced by viscous drag on the cantilever in macromolecular manipulation experiments using the atomic force microscope. The cantilever experiences a viscous drag force in these experiments because of its motion relative to the surrounding liquid. This viscous force superimposes onto the force generated by the macromolecule under study, causing ambiguity in the experimental data. To remove this artifact, we analyzed the motions of the cantilever and the liquid in macromolecular manipulation experiments, and developed a novel model to treat the viscous drag on the cantilever as the superposition of the viscous force on a static cantilever in a moving liquid and that on a bending cantilever in a static liquid. The viscous force was measured under both conditions and the results were used to correct the viscous drag induced errors from the experimental data. The method will be useful for many other cantilever based techniques, especially when high viscosity and high cantilever speed are involved. PMID:20590242

  3. Correction of the viscous drag induced errors in macromolecular manipulation experiments using atomic force microscope

    PubMed Central

    Liu, Runcong; Roman, Marisa; Yang, Guoliang

    2010-01-01

    We describe a method to correct the errors induced by viscous drag on the cantilever in macromolecular manipulation experiments using the atomic force microscope. The cantilever experiences a viscous drag force in these experiments because of its motion relative to the surrounding liquid. This viscous force superimposes onto the force generated by the macromolecule under study, causing ambiguity in the experimental data. To remove this artifact, we analyzed the motions of the cantilever and the liquid in macromolecular manipulation experiments, and developed a novel model to treat the viscous drag on the cantilever as the superposition of the viscous force on a static cantilever in a moving liquid and that on a bending cantilever in a static liquid. The viscous force was measured under both conditions and the results were used to correct the viscous drag induced errors from the experimental data. The method will be useful for many other cantilever based techniques, especially when high viscosity and high cantilever speed are involved. PMID:20590242

  4. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    SciTech Connect

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-15

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm/{radical}(Hz) by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  5. Small cantilevers for atomic force microscopy and force spectroscopy of biological molecules

    NASA Astrophysics Data System (ADS)

    Viani, M. B.; Schaffer, T. E.; Chand, A.; Smith, B. L.; Hansma, P. K.; Wendman, M.

    1998-03-01

    Small cantilevers offer new possibilities for high speed/low noise atomic force microscopy of soft, biological samples. We have used a novel process to fabricate metallic cantilevers that should maximize reflectivity and minimize thermal bending. We have fabricated and measured the properties of aluminum, nickel, silver, and 14-karat gold cantilevers that are 3-12 um long, 1-4 um wide, and 60-300 nm thick and have resonant frequencies of 0.5-2 MHz and spring constants of 0.1-3 N/m. We also have fabricated small cantilevers with ultra-low spring constants (1-10 mN/m) out of silicon nitride and used them for force spectroscopy of DNA. This work was supported by grant numbers NSF-DMR9622169 and NSF-DMR9632716 from the Materials Research Division of the National Science Foundation and by grant number DAAH04-96-1-004 from the Army Research Office.

  6. Implementation of Akiyama probe in low temperature magnetic force microscope

    NASA Astrophysics Data System (ADS)

    Sass, Paul; Wu, Weida

    Exotic phenomena often call for high sensitivity scanning probe microscopic techniques working at extremely low temperatures. Specifically, it is of great fundamental interest to detect the weak magnetic signals in a range of interesting systems such as, quantum anomalous Hall, skyrmion, heavy-fermion, and multiferroic systems. To this end, we are developing low temperature magnetic force microscope (MFM) using a self-sensing cantilever called Akiyama-probe (A-probe). The main advantage of this specific probe is its extremely low power-dissipation compared to other self-sensing (e.g. piezoresistive) cantilevers for low temperature application. We will present progress of the implementation of A-probe and preliminary results under various conditions. This work is supported by DOE BES under Award DE-SC0008147.

  7. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans.

    PubMed

    Meier, Tobias; Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm(3) is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  8. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    PubMed Central

    Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    Summary We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  9. Electric force microscopy of semiconductors: Theory of cantilever frequency fluctuations and noncontact friction

    SciTech Connect

    Lekkala, Swapna; Marohn, John A.; Loring, Roger F.

    2013-11-14

    An electric force microscope employs a charged atomic force microscope probe in vacuum to measure fluctuating electric forces above the sample surface generated by dynamics of molecules and charge carriers. We present a theoretical description of two observables in electric force microscopy of a semiconductor: the spectral density of cantilever frequency fluctuations (jitter), which are associated with low-frequency dynamics in the sample, and the coefficient of noncontact friction, induced by higher-frequency motions. The treatment is classical-mechanical, based on linear response theory and classical electrodynamics of diffusing charges in a dielectric continuum. Calculations of frequency jitter explain the absence of contributions from carrier dynamics to previous measurements of an organic field effect transistor. Calculations of noncontact friction predict decreasing friction with increasing carrier density through the suppression of carrier density fluctuations by intercarrier Coulomb interactions. The predicted carrier density dependence of the friction coefficient is consistent with measurements of the dopant density dependence of noncontact friction over Si. Our calculations predict that in contrast to the measurement of cantilever frequency jitter, a noncontact friction measurement over an organic semiconductor could show appreciable contributions from charge carriers.

  10. Electric force microscopy of semiconductors: theory of cantilever frequency fluctuations and noncontact friction.

    PubMed

    Lekkala, Swapna; Marohn, John A; Loring, Roger F

    2013-11-14

    An electric force microscope employs a charged atomic force microscope probe in vacuum to measure fluctuating electric forces above the sample surface generated by dynamics of molecules and charge carriers. We present a theoretical description of two observables in electric force microscopy of a semiconductor: the spectral density of cantilever frequency fluctuations (jitter), which are associated with low-frequency dynamics in the sample, and the coefficient of noncontact friction, induced by higher-frequency motions. The treatment is classical-mechanical, based on linear response theory and classical electrodynamics of diffusing charges in a dielectric continuum. Calculations of frequency jitter explain the absence of contributions from carrier dynamics to previous measurements of an organic field effect transistor. Calculations of noncontact friction predict decreasing friction with increasing carrier density through the suppression of carrier density fluctuations by intercarrier Coulomb interactions. The predicted carrier density dependence of the friction coefficient is consistent with measurements of the dopant density dependence of noncontact friction over Si. Our calculations predict that in contrast to the measurement of cantilever frequency jitter, a noncontact friction measurement over an organic semiconductor could show appreciable contributions from charge carriers. PMID:24320286

  11. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Proksch, Roger

    2015-06-01

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  12. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  13. Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

    SciTech Connect

    Barkley, Sarice S.; Cannara, Rachel J.; Deng Zhao; Gates, Richard S.; Reitsma, Mark G.

    2012-02-15

    Two independent lateral-force calibration methods for the atomic force microscope (AFM)--the hammerhead (HH) technique and the diamagnetic lateral force calibrator (D-LFC)--are systematically compared and found to agree to within 5% or less, but with precision limited to about 15%, using four different tee-shaped HH reference probes. The limitations of each method, both of which offer independent yet feasible paths toward traceable accuracy, are discussed and investigated. We find that stiff cantilevers may produce inconsistent D-LFC values through the application of excessively high normal loads. In addition, D-LFC results vary when the method is implemented using different modes of AFM feedback control, constant height and constant force modes, where the latter is more consistent with the HH method and closer to typical experimental conditions. Specifically, for the D-LFC apparatus used here, calibration in constant height mode introduced errors up to 14 %. In constant force mode using a relatively stiff cantilever, we observed an {approx_equal} 4 % systematic error per {mu}N of applied load for loads {<=} 1 {mu}N. The issue of excessive load typically emerges for cantilevers whose flexural spring constant is large compared with the normal spring constant of the D-LFC setup (such that relatively small cantilever flexural displacements produce relatively large loads). Overall, the HH method carries a larger uncertainty, which is dominated by uncertainty in measurement of the flexural spring constant of the HH cantilever as well as in the effective length dimension of the cantilever probe. The D-LFC method relies on fewer parameters and thus has fewer uncertainties associated with it. We thus show that it is the preferred method of the two, as long as care is taken to perform the calibration in constant force mode with low applied loads.

  14. Hyperbaric Hydrothermal Atomic Force Microscope

    DOEpatents

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  15. Hyperbaric hydrothermal atomic force microscope

    DOEpatents

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  16. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    SciTech Connect

    Karcı, Özgür; Dede, Münir

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  17. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution.

    PubMed

    Karcı, Özgür; Dede, Münir; Oral, Ahmet

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ∼12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system. PMID:25362401

  18. Localized Spectroscopy using a Magnetic Resonance Force Microscope.

    NASA Astrophysics Data System (ADS)

    Moresi, Giorgio; Lin, Qiong; Mouaziz, Schahrazede; Hunkeler, Andreas; Degen, Christian; Meier, Urban; Brugger, Juerger; Meier, Beat

    2006-03-01

    The Magnetic Resonance Force Microscope (MRFM) constitutes a promising next-generation magnetic resonance detection device at room temperature. A MRFM observes nuclear (or electron) spin magnetization as a force, which occurs when a paramagnetic sample is polarized in inhomogeneous static magnetic field (10E5 T/m) and a high frequency drives the cantilever on-resonance by a cyclic adiabatic modulation, which make able to measure T1 rho. In this contribution, we combine the MRFM with spin-echo spectroscopy to add spectral resolution to NMR signals of micro-scale objects at room temperature. First experimental spectra recorded with the amplitude detection technique from a sample of barium chlorate monohydrate and ammonium sulfate single crystals mounted on a non commercial cantilever show resolution of 2μm and a sensitivity of 10E13 spins. The new microscope, which uses the frequency detection down to m-Hz resolution and the annealed non-commercials cantilevers, which have Q factor up to 250000 at room temperature, improve the sensitivity to 10E9 spins. This new setup and a new measurement technique should make able to measure T1.

  19. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  20. Surface effect on the nonlinear forced vibration of cantilevered nanobeams

    NASA Astrophysics Data System (ADS)

    Dai, H. L.; Zhao, D. M.; Zou, J. J.; Wang, L.

    2016-06-01

    The nonlinear forced vibration behavior of a cantilevered nanobeam is investigated in this paper, essentially considering the effect due to the surface elastic layer. The governing equation of motion for the nano-cantilever is derived, with consideration of the geometrical nonlinearity and the effects of additional flexural rigidity and residual stress of the surface layer. Then, the nonlinear partial differential equation (PDE) is discretized into a set of nonlinear ordinary differential equations (ODEs) by means of the Galerkin's technique. It is observed that surface effects on the natural frequency of the nanobeam is of significance, especially for the case when the aspect ratio of the nanobeam is large. The nonlinear resonant dynamics of the nanobeam system is evaluated by varying the excitation frequency around the fundamental resonance, showing that the nanobeam would display hardening-type behavior and hence the frequency-response curves bend to the right in the presence of positive residual surface stress. However, with the negative residual surface stress, this hardening-type behavior can be shifted to a softening-type one which becomes even more evident with increase of the aspect ratio parameter. It is also demonstrated that the combined effects of the residual stress and aspect ratio on the maximum amplitude of the nanobeam may be pronounced.

  1. Simultaneous normal and torsional force measurement by cantilever surface contour analysis

    NASA Astrophysics Data System (ADS)

    Kumanchik, Lee; Schmitz, Tony; Pratt, Jon

    2011-05-01

    This study presents an alternative to the current Hooke's law-based force relation between rectangular cantilever deflection and applied force. In the new approach, a transduction constant is presented that (1) includes no cross-talk between torsion and normal force components, (2) is independent of the load application point, and (3) does not depend on the cantilever beam length. Rather than measuring the cantilever deformation at a single point (such as the tip location), it is measured at multiple adjacent points using scanning white light interferometry to provide a three-dimensional description of the cantilever deformation during loading. This measurement, processed by a force relation based on a superposition of deflections derived from Euler-Bernoulli bending theory and St Venant's torsion theory, provides the vertical, axial, and torsional force components simultaneously. Experimental results are compared to force predictions for the vertical and torsional components using macro-scale cantilevers under mass loading. An uncertainty analysis is also provided.

  2. A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers

    SciTech Connect

    Quintanilla, M. A. S.; Goddard, D. T.

    2008-02-15

    A calibration method is described for colloidal probe cantilevers that enables friction force measurements obtained using lateral force microscopy (LFM) to be quantified. The method is an adaptation of the lever method of Feiler et al. [A. Feiler, P. Attard, and I. Larson, Rev. Sci. Instum. 71, 2746 (2000)] and uses the advantageous positioning of probe particles that are usually offset from the central axis of the cantilever. The main sources of error in the calibration method are assessed, in particular, the potential misalignment of the long axis of the cantilever that ideally should be perpendicular to the photodiode detector. When this is not taken into account, the misalignment is shown to have a significant effect on the cantilever torsional stiffness but not on the lateral photodiode sensitivity. Also, because the friction signal is affected by the topography of the substrate, the method presented is valid only against flat substrates. Two types of particles, 20 {mu}m glass beads and UO{sub 3} agglomerates attached to silicon tapping mode cantilevers were used to test the method against substrates including glass, cleaved mica, and UO{sub 2} single crystals. Comparisons with the lateral compliance method of Cain et al. [R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000)] are also made.

  3. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect

    Balantekin, M.; Satır, S.; Torello, D.; Değertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  4. High bandwidth deflection readout for atomic force microscopes.

    PubMed

    Steininger, Juergen; Bibl, Matthias; Yoo, Han Woong; Schitter, Georg

    2015-10-01

    This contribution presents the systematic design of a high bandwidth deflection readout mechanism for atomic force microscopes. The widely used optical beam deflection method is revised by adding a focusing lens between the cantilever and the quadrant photodetector (QPD). This allows the utilization of QPDs with a small active area resulting in an increased detection bandwidth due to the reduced junction capacitance. Furthermore the additional lens can compensate a cross talk between a compensating z-movement of the cantilever and the deflection readout. Scaling effects are analyzed to get the optimal spot size for the given geometry of the QPD. The laser power is tuned to maximize the signal to noise ratio without limiting the bandwidth by local saturation effects. The systematic approach results in a measured -3 dB detection bandwidth of 64.5 MHz at a deflection noise density of 62fm/√Hz. PMID:26520960

  5. High bandwidth deflection readout for atomic force microscopes

    NASA Astrophysics Data System (ADS)

    Steininger, Juergen; Bibl, Matthias; Yoo, Han Woong; Schitter, Georg

    2015-10-01

    This contribution presents the systematic design of a high bandwidth deflection readout mechanism for atomic force microscopes. The widely used optical beam deflection method is revised by adding a focusing lens between the cantilever and the quadrant photodetector (QPD). This allows the utilization of QPDs with a small active area resulting in an increased detection bandwidth due to the reduced junction capacitance. Furthermore the additional lens can compensate a cross talk between a compensating z-movement of the cantilever and the deflection readout. Scaling effects are analyzed to get the optimal spot size for the given geometry of the QPD. The laser power is tuned to maximize the signal to noise ratio without limiting the bandwidth by local saturation effects. The systematic approach results in a measured -3 dB detection bandwidth of 64.5 MHz at a deflection noise density of 62 fm / √{ Hz } .

  6. Silicon cantilever functionalization for cellulose-specific chemical force imaging of switchgrass

    DOE PAGESBeta

    Lee, Ida; Evans, Barbara R.; Foston, Marcus B.; Ragauskas, Arthur J.

    2015-05-08

    A method for direct functionalization of silicon and silicon nitride cantilevers with bifunctional silanes was tested with model surfaces to determine adhesive forces for different hydrogen-bonding chemistries. Application for biomass surface characterization was tested by mapping switchgrass and isolated switchgrass cellulose in topographic and force-volume mode using a cellulose-specific cantilever.

  7. Silicon cantilever functionalization for cellulose-specific chemical force imaging of switchgrass

    SciTech Connect

    Lee, Ida; Evans, Barbara R; Foston, Marcus B; Ragauskas, Arthur J

    2015-01-01

    A method for direct functionalization of silicon and silicon nitride cantilevers with bifunctional silanes was tested with model surfaces to determine adhesive forces for different hydrogen-bonding chemistries. Application for biomass surface characterization was tested by mapping switchgrass and isolated switchgrass cellulose in topographic and force-volume mode using a cellulose-specific cantilever.

  8. Piezoresistive cantilever working in a shear force mode for in situ characterization of exposed micro- and nanostructures

    NASA Astrophysics Data System (ADS)

    Sierakowski, Andrzej; Kopiec, Daniel; Janus, Paweł; Ekwińska, Magdalena; Płuska, Mariusz; Grabiec, Piotr; Gotszalk, Teodor

    2014-04-01

    This paper presents a method of characterization micro- and nanostructures defined in a photolithography process. To implement this method a measurement system composed of an atomic force microscope (AFM) integrated with a system for maskless lithography was developed. This integration enables exposed patterns to be examined in situ, without any necessity for a developing process. The microscope works in a shear force mode, uses a cantilever with a piezoresistive method of detecting deflection and can be used for measuring surfaces with high aspect ratio by applying an appropriate technology of sharpening in a focused ion beam process. The cantilever fabrication process, its calibration and examination procedures are presented. Finally, the AFM images of structures scanned directly after exposure are shown.

  9. Radiation pressure excitation of Low Temperature Atomic Force & Magnetic Force Microscope (LT-AFM/MFM) for Imaging

    NASA Astrophysics Data System (ADS)

    Karci, Ozgur; Celik, Umit; Oral, Ahmet; NanoMagnetics Instruments Ltd. Team; Middle East Tech Univ Team

    2015-03-01

    We describe a novel method for excitation of Atomic Force Microscope (AFM) cantilevers by means of radiation pressure for imaging in an AFM for the first time. Piezo excitation is the most common method for cantilever excitation, but it may cause spurious resonance peaks. A fiber optic interferometer with 1310 nm laser was used both to measure the deflection of cantilever and apply a force to the cantilever in a LT-AFM/MFM from NanoMagnetics Instruments. The laser power was modulated at the cantilever`s resonance frequency by a digital Phase Lock Loop (PLL). The force exerted by the radiation pressure on a perfectly reflecting surface by a laser beam of power P is F = 2P/c. We typically modulate the laser beam by ~ 800 μW and obtain 10nm oscillation amplitude with Q ~ 8,000 at 2.5x10-4 mbar. The cantilever's stiffness can be accurately calibrated by using the radiation pressure. We have demonstrated performance of the radiation pressure excitation in AFM/MFM by imaging a hard disk sample between 4-300K and Abrikosov vortex lattice in BSCCO single crystal at 4K to for the first time.

  10. Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

    SciTech Connect

    Ergincan, O. Palasantzas, G.; Kooi, B. J.

    2014-02-15

    The determination of the dynamic spring constant (k{sub d}) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the non-destructive, fast, and accurate measurement method of the cantilever dynamic spring constant by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012)] is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (k{sub eff}, the dynamic one k{sub d}), and the calculated (k{sub d,1}) are in good agreement within less than 10% error.

  11. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  12. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy.

    PubMed

    Loganathan, Muthukumaran; Bristow, Douglas A

    2014-04-01

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields. PMID:24784614

  13. Thermal writing using a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Mamin, H. J.

    1996-07-01

    Resistive heating of an atomic force microscope tip was used to perform thermally induced surface modifications. Heating was achieved by dissipating power in the legs of an electrically conducting silicon cantilever. Temperatures of up to 170 °C were obtained using 40 mW of input power. Electrical measurements used to monitor the temperature showed thermal time constants of 0.35-0.45 ms, depending on whether the tip was in contact with a substrate. The heated tip was used to demonstrate thermomechanical writing on a polycarbonate substrate, as well as thermal writing of an optical phase change material.

  14. A variable temperature ultrahigh vacuum atomic force microscope

    SciTech Connect

    Dai, Q.; Vollmer, R.; Carpick, R.W.; Ogletree, D.F.; Salmeron, M.

    1995-11-01

    A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from {approx}100 K to room temperature. AFM operation above room temperature is also possible. The microscope head is capable of coarse {ital x}-{ital y} positioning over millimeter distances so that AFM images can be taken virtually anywhere upon a macroscopic sample. The optical beam deflection scheme is used for detection, allowing simultaneous normal and lateral force measurements. The sample can be transferred from the AFM stage to a low energy electron diffraction/Auger electron spectrometer stage for surface analysis. Atomic lattice resolution AFM images taken in UHV are presented at 110, 296, and 430 K. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.

  15. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    NASA Technical Reports Server (NTRS)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  16. Differential force microscope for long time-scale biophysical measurements

    PubMed Central

    Choy, Jason L.; Parekh, Sapun H.; Chaudhuri, Ovijit; Liu, Allen P.; Bustamante, Carlos; Footer, Matthew J.; Theriot, Julie A.; Fletcher, Daniel A.

    2011-01-01

    Force microscopy techniques including optical trapping, magnetic tweezers, and atomic force microscopy (AFM) have facilitated quantification of forces and distances on the molecular scale. However, sensitivity and stability limitations have prevented the application of these techniques to biophysical systems that generate large forces over long times, such as actin filament networks. Growth of actin networks drives cellular shape change and generates nano-Newtons of force over time scales of minutes to hours, and consequently network growth properties have been difficult to study. Here, we present an AFM-based differential force microscope with integrated epifluorescence imaging in which two adjacent cantilevers on the same rigid support are used to provide increased measurement stability. We demonstrate 14 nm displacement control over measurement times of 3 hours and apply the instrument to quantify actin network growth in vitro under controlled loads. By measuring both network length and total network fluorescence simultaneously, we show that the average cross-sectional density of the growing network remains constant under static loads. The differential force microscope presented here provides a sensitive method for quantifying force and displacement with long time-scale stability that is useful for measurements of slow biophysical processes in whole cells or in reconstituted molecular systems in vitro. PMID:17477674

  17. Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

    SciTech Connect

    Wagner, Ryan; Raman, Arvind; Proksch, Roger

    2013-12-23

    Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

  18. A homemade atomic force microscope based on a quartz tuning fork for undergraduate instruction

    NASA Astrophysics Data System (ADS)

    Li, Yingzi; Zhang, Liwen; Shan, Guanqiao; Song, Zihang; Yang, Rui; Li, Hua; Qian, Jianqiang

    2016-06-01

    Atomic force microscopes are a key tool in nanotechnology that overcome the limitations of optical microscopes and provide imaging capabilities with nanoscale resolution. We have developed an atomic force microscope that uses an inexpensive quartz tuning fork as a micro cantilever. Because of its ease of operation and its open structure, it can be easily customized by students. Due to its low costs, it is possible that every student in the course has access to one setup, allowing all students to obtain deep insights into nanotechnology and to understand the principles of atomic force microscopy.

  19. Direct measurement of single-molecule visco-elasticity in atomic force microscope force-extension experiments.

    PubMed

    Bippes, Christian A; Humphris, Andrew D L; Stark, Martin; Müller, Daniel J; Janovjak, Harald

    2006-02-01

    Measuring the visco-elastic properties of biological macromolecules constitutes an important step towards the understanding of dynamic biological processes, such as cell adhesion, muscle function, or plant cell wall stability. Force spectroscopy techniques based on the atomic force microscope (AFM) are increasingly used to study the complex visco-elastic response of (bio-)molecules on a single-molecule level. These experiments either require that the AFM cantilever is actively oscillated or that the molecule is clamped at constant force to monitor thermal cantilever motion. Here we demonstrate that the visco-elasticity of single bio-molecules can readily be extracted from the Brownian cantilever motion during conventional force-extension measurements. It is shown that the characteristics of the cantilever determine the signal-to-noise (S/N) ratio and time resolution. Using a small cantilever, the visco-elastic properties of single dextran molecules were resolved with a time resolution of 8.3 ms. The presented approach can be directly applied to probe the dynamic response of complex bio-molecular systems or proteins in force-extension experiments. PMID:16237549

  20. Selective nano-patterning of graphene using a heated atomic force microscope tip

    SciTech Connect

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-15

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

  1. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Wagner, R.; Woehl, T. J.; Keller, R. R.; Killgore, J. P.

    2016-07-01

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  2. Relative surface charge density mapping with the atomic force microscope.

    PubMed Central

    Heinz, W F; Hoh, J H

    1999-01-01

    An experimental approach for producing relative charge density maps of biological surfaces using the atomic force microscope is presented. This approach, called D minus D (D-D) mapping, uses isoforce surfaces collected at different salt concentrations to remove topography and isolate electrostatic contributions to the tip-sample interaction force. This approach is quantitative for surface potentials below 25 mV, and does not require prior knowledge of the cantilever spring constant, tip radius, or tip charge. In addition, D-D mapping does not require tip-sample contact. The performance of D-D mapping is demonstrated on surfaces of constant charge and varying topography (mechanically roughened mica and stacked bilayers of dipalmitolphosphatidylserine), a surface of varying charge and varying topography (patches of dipalmitolphosphatidylcholine on mica), and bacteriorhopsin membranes adsorbed to mica. PMID:9876166

  3. Cell force measurements in 3D microfabricated environments based on compliant cantilevers.

    PubMed

    Marelli, Mattia; Gadhari, Neha; Boero, Giovanni; Chiquet, Matthias; Brugger, Jürgen

    2014-01-21

    We report the fabrication, functionalization and testing of microdevices for cell culture and cell traction force measurements in three-dimensions (3D). The devices are composed of bent cantilevers patterned with cell-adhesive spots not lying on the same plane, and thus suspending cells in 3D. The cantilevers are soft enough to undergo micrometric deflections when cells pull on them, allowing cell forces to be measured by means of optical microscopy. Since individual cantilevers are mechanically independent of each other, cell traction forces are determined directly from cantilever deflections. This proves the potential of these new devices as a tool for the quantification of cell mechanics in a system with well-defined 3D geometry and mechanical properties. PMID:24217771

  4. Blocked force measurement of an electro-active paper actuator using a cantilevered force transducer

    NASA Astrophysics Data System (ADS)

    Yun, Gyu-young; Kim, Heung Soo; Kim, Jaehwan

    2008-04-01

    The blocked force of an electro-active paper (EAPap) actuator was measured by a custom-built force transducer. The tip deflection of the force transducer was measured and converted into force using a simple Euler beam model. Since the blocked force is the maximum force generated at the tip of a bending actuator without displacement, the blocked force was found from the measured force of the transducer by extrapolating it. The force transducer was made from a thin steel cantilever beam and calibrated using a linear stage and a micro-balance. The measured maximum free bending displacement of the EAPap actuator was 4.4 mm and the blocked force was 224 µN under 350 V mm-1 AC electric field and 33 µN under DC electric field with the same field strength. When an AC electric field was applied to the actuator, the generated blocked force of the EAPap was about 700% larger than that caused by DC excitation. The proposed blocked force measurement is accurate down to a micro-Newton resolution under DC as well as AC electric fields.

  5. Long reach cantilevers for sub-cellular force measurements.

    PubMed

    Paneru, Govind; Thapa, Prem S; McBride, Sean P; Ramm, Adam; Law, Bruce M; Flanders, Bret N

    2012-11-16

    Maneuverable, high aspect ratio poly(3,4-ethylene dioxythiophene) (PEDOT) fibers are fabricated for use as cellular force probes that can interface with individual pseudopod adhesive contact sites without forming unintentional secondary contacts to the cell. The straight fibers have lengths between 5 and 40 μm and spring constants in the 0.07-23.2 nN μm(-1) range. The spring constants of these fibers were measured directly using an atomic force microscope (AFM). These AFM measurements corroborate determinations based on the transverse vibrational resonance frequencies of the fibers, which is a more convenient method. These fibers are employed to characterize the time dependent forces exerted at adhesive contacts between apical pseudopods of highly migratory D. discoideum cells and the PEDOT fibers, finding an average terminal force of 3.1 ± 2.7 nN and lifetime of 23.4 ± 18.5 s to be associated with these contacts. PMID:23085541

  6. Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy.

    SciTech Connect

    Choi, H.; Hong, S.; No, K.

    2011-01-01

    A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d{sub 31} of BaTiO{sub 3} single crystal (-81.62 {+-} 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.

  7. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    NASA Astrophysics Data System (ADS)

    Bentley, Mark Stephen; Arends, Herman; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-08-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of tip geometries.

  8. Force sensing submicrometer thick cantilevers with ultra-thin piezoresistors by rapid thermal diffusion

    NASA Astrophysics Data System (ADS)

    Gel, M.; Shimoyama, I.

    2004-03-01

    One of the most important requirements for a cantilever-type sensor to obtain high force sensitivity is small thickness. By using current micromachining technology it is possible to produce cantilevers of submicrometer thickness. Where self-sensing piezoresistive cantilevers with submicrometer thickness are concerned, it is necessary to use a technology which can create ultra-thin (<100 nm) piezoresistors on a cantilever surface. This work demonstrates for the first time the application of a relatively simple, rapid thermal diffusion method by using spin-on glass film to fabricate sub-100 nm piezoresistors on an ultra-thin single-crystal silicon cantilever. Compared to other shallow junction fabrication methods, which involve implantation or deposition of a doped layer, this method is advantageous since no damage is created in the crystal structure and no toxic gas or hazardous material is used during the process. Besides, this technique can be applied by using low-cost rapid annealers, which can be readily found in most laboratories. By using this method, piezoresistive cantilevers with stiffness in the range of 0.001 N m-1 with sub-100 nm thick piezoresistors are fabricated, and a complete characterization of the fabricated cantilevers is performed.

  9. Gating mechanosensitive channels in bacteria with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Garces, Renata; Miller, Samantha; Schmidt, Christoph F.; Third Institute of Physics Team; School of Medical Sciences Collaboration

    The regulation of growth and integrity of bacteria is critically linked to mechanical stress. Bacteria typically maintain a high difference of osmotic pressure (turgor pressure) with respect to the environment. This pressure difference (on the order of 1 atm) is supported by the cell envelope, a composite of lipid membranes and a rigid cell wall. Turgor pressure is controlled by the ratio of osmolytes inside and outside bacteria and thus, can abruptly increase upon osmotic downshock. For structural integrity bacteria rely on the mechanical stability of the cell wall and on the action of mechanosensitive (MS) channels: membrane proteins that release solutes in response to stress in the cell envelope. We here present experimental data on MS channels gating. We activate channels by indenting living bacteria with the cantilever of an atomic force microscope (AFM). We compare responses of wild-type and mutant bacteria in which some or all MS channels have been eliminated.

  10. A subsurface add-on for standard atomic force microscopes

    SciTech Connect

    Verbiest, G. J.; Zalm, D. J. van der; Oosterkamp, T. H.; Rost, M. J.

    2015-03-15

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  11. The mapping of yeast's G-protein coupled receptor with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Takenaka, Musashi; Miyachi, Yusuke; Ishii, Jun; Ogino, Chiaki; Kondo, Akihiko

    2015-03-01

    An atomic force microscope (AFM) can measure the adhesion force between a sample and a cantilever while simultaneously applying a rupture force during the imaging of a sample. An AFM should be useful in targeting specific proteins on a cell surface. The present study proposes the use of an AFM to measure the adhesion force between targeting receptors and their ligands, and to map the targeting receptors. In this study, Ste2p, one of the G protein-coupled receptors (GPCRs), was chosen as the target receptor. The specific force between Ste2p on a yeast cell surface and a cantilever modified with its ligand, α-factor, was measured and found to be approximately 250 pN. In addition, through continuous measuring of the cell surface, a mapping of the receptors on the cell surface could be performed, which indicated the differences in the Ste2p expression levels. Therefore, the proposed AFM system is accurate for cell diagnosis.

  12. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading

    SciTech Connect

    Kennedy, Scott J.; Cole, Daniel G.; Clark, Robert L.

    2009-12-15

    This work presents a method for force calibration of rectangular atomic force microscopy (AFM) microcantilevers under heavy fluid loading. Theoretical modeling of the thermal response of microcantilevers is discussed including a fluid-structure interaction model of the cantilever-fluid system that incorporates the results of the fluctuation-dissipation theorem. This model is curve fit to the measured thermal response of a cantilever in de-ionized water and a cost function is used to quantify the difference between the theoretical model and measured data. The curve fit is performed in a way that restricts the search space to parameters that reflect heavy fluid loading conditions. The resulting fitting parameters are used to calibrate the cantilever. For comparison, cantilevers are calibrated using Sader's method in air and the thermal noise method in both air and water. For a set of eight cantilevers ranging in stiffness from 0.050 to 5.8 N/m, the maximum difference between Sader's calibration performed in air and the new method performed in water was 9.4%. A set of three cantilevers that violate the aspect ratio assumption associated with the fluid loading model (length-to-width ratios less than 3.5) ranged in stiffness from 0.85 to 4.7 N/m and yielded differences as high as 17.8%.

  13. Electrothermally driven high-frequency piezoresistive SiC cantilevers for dynamic atomic force microscopy

    SciTech Connect

    Boubekri, R.; Cambril, E.; Couraud, L.; Bernardi, L.; Madouri, A.; Portail, M.; Chassagne, T.; Moisson, C.; Zielinski, M.; Jiao, S.; Michaud, J.-F.; Alquier, D.; Bouloc, J.; Nony, L.; Bocquet, F.; Loppacher, C.

    2014-08-07

    Cantilevers with resonance frequency ranging from 1 MHz to 100 MHz have been developed for dynamic atomic force microscopy. These sensors are fabricated from 3C-SiC epilayers grown on Si(100) substrates by low pressure chemical vapor deposition. They use an on-chip method both for driving and sensing the displacement of the cantilever. A first gold metallic loop deposited on top of the cantilever is used to drive its oscillation by electrothermal actuation. The sensing of this oscillation is performed by monitoring the resistance of a second Au loop. This metallic piezoresistive detection method has distinct advantages relative to more common semiconductor-based schemes. The optimization, design, fabrication, and characteristics of these cantilevers are discussed.

  14. Flexural Vibration Test of a Cantilever Beam with a Force Sensor: Fast Determination of Young's Modulus

    ERIC Educational Resources Information Center

    Digilov, Rafael M.

    2008-01-01

    We describe a simple and very inexpensive undergraduate laboratory experiment for fast determination of Young's modulus at moderate temperatures with the aid of a force sensor. A strip-shaped specimen rigidly bolted to the force sensor forms a clamped-free cantilever beam. Placed in a furnace, it is subjected to free-bending vibrations followed by…

  15. Single cell adhesion force measurement for cell viability identification using an AFM cantilever-based micro putter

    NASA Astrophysics Data System (ADS)

    Shen, Yajing; Nakajima, Masahiro; Kojima, Seiji; Homma, Michio; Kojima, Masaru; Fukuda, Toshio

    2011-11-01

    Fast and sensitive cell viability identification is a key point for single cell analysis. To address this issue, this paper reports a novel single cell viability identification method based on the measurement of single cell shear adhesion force using an atomic force microscopy (AFM) cantilever-based micro putter. Viable and nonviable yeast cells are prepared and put onto three kinds of substrate surfaces, i.e. tungsten probe, gold and ITO substrate surfaces. A micro putter is fabricated from the AFM cantilever by focused ion beam etching technique. The spring constant of the micro putter is calibrated using the nanomanipulation approach. The shear adhesion force between the single viable or nonviable cell and each substrate is measured using the micro putter based on the nanorobotic manipulation system inside an environmental scanning electron microscope. The adhesion force is calculated based on the deflection of the micro putter beam. The results show that the adhesion force of the viable cell to the substrate is much larger than that of the nonviable cell. This identification method is label free, fast, sensitive and can give quantitative results at the single cell level.

  16. Atomic Force Microscopy in Dynamic Mode with Displacement Current Detection in Double Cantilever Devices

    NASA Astrophysics Data System (ADS)

    Müller, Falk; Müller, Anne‑Dorothea; Hietschold, Michael; Gessner, Thomas

    2006-03-01

    A cantilever array for dynamic mode atomic force microscopy (AFM) is presented, the vertical displacement of which is analyzed by the detection of displacement currents in the electrodes. Each cantilever in the array consists of an actuation part that allows an independent vertical movement, and a sensor part. The lateral distance between the tips of the different cantilevers is fixed to 10 μm. When operated as an actuator, a voltage is applied between the silicon membrane and the underlaying electrode. Due to the resulting coulomb forces, the vertical position of the tip is controllable. The reaction time in this mode is shorter than the response time of a piezostack. The sensor part, on the other hand, allows the device to work in dynamic mode without a laser deflection system. The vertical resolution achieved is below 1 nm. The dependence of force distance curves on the excitation amplitude is shown.

  17. Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy.

    PubMed

    Deng, Wenqi; Zhang, Guang-Ming; Murphy, Mark F; Lilley, Francis; Harvey, David M; Burton, David R

    2015-10-01

    Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behavior of tapping mode AFM has been investigated using mathematical modeling, comprehensive understanding of the behavior of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever's dynamic behavior in tapping mode AFM is studied through a three dimensional finite element method. The cantilever's dynamic displacement responses are firstly obtained via simulation under different tip-sample separations, and for different tip-sample interaction forces, such as elastic force, adhesion force, viscosity force, and the van der Waals force, which correspond to the cantilever's action upon various different representative computer-generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone, and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude, and frequency changes are then analyzed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations. PMID:26303510

  18. Investigation of polymer derived ceramics cantilevers for application of high speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Wu, Chia-Yun

    High speed Atomic Force Microscopy (AFM) has a wide variety of applications ranging from nanomanufacturing to biophysics. In order to have higher scanning speed of certain AFM modes, high resonant frequency cantilevers are needed; therefore, the goal of this research is to investigate using polymer derived ceramics for possible applications in making high resonant frequency AFM cantilevers using complex cross sections. The polymer derived ceramic that will be studied, is silicon carbide. Polymer derived ceramics offer a potentially more economic fabrication approach for MEMS due to their relatively low processing temperatures and ease of complex shape design. Photolithography was used to make the desired cantilever shapes with micron scale size followed by a wet etching process to release the cantilevers from the substrates. The whole manufacturing process we use borrow well-developed techniques from the semiconducting industry, and as such this project also could offer the opportunity to reduce the fabrication cost of AFM cantilevers and MEMS in general. The characteristics of silicon carbide made from the precursor polymer, SMP-10 (Starfire Systems), were studied. In order to produce high qualities of silicon carbide cantilevers, where the major concern is defects, proper process parameters needed to be determined. Films of polymer derived ceramics often have defects due to shrinkage during the conversion process. Thus control of defects was a central issue in this study. A second, related concern was preventing oxidation; the polymer derived ceramics we chose is easily oxidized during processing. Establishing an environment without oxygen in the whole process was a significant challenge in the project. The optimization of the parameters for using photolithography and wet etching process was the final and central goal of the project; well established techniques used in microfabrication were modified for use in making the cantilever in the project. The techniques

  19. Design optimization of piezoresistive cantilevers for force sensing in air and water

    PubMed Central

    Doll, Joseph C.; Park, Sung-Jin; Pruitt, Beth L.

    2009-01-01

    Piezoresistive cantilevers fabricated from doped silicon or metal films are commonly used for force, topography, and chemical sensing at the micro- and macroscales. Proper design is required to optimize the achievable resolution by maximizing sensitivity while simultaneously minimizing the integrated noise over the bandwidth of interest. Existing analytical design methods are insufficient for modeling complex dopant profiles, design constraints, and nonlinear phenomena such as damping in fluid. Here we present an optimization method based on an analytical piezoresistive cantilever model. We use an existing iterative optimizer to minimimize a performance goal, such as minimum detectable force. The design tool is available as open source software. Optimal cantilever design and performance are found to strongly depend on the measurement bandwidth and the constraints applied. We discuss results for silicon piezoresistors fabricated by epitaxy and diffusion, but the method can be applied to any dopant profile or material which can be modeled in a similar fashion or extended to other microelectromechanical systems. PMID:19865512

  20. First Atomic Force Microscope Image from Mars

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This calibration image presents three-dimensional data from the atomic force microscope on NASA's Phoenix Mars Lander, showing surface details of a substrate on the microscope station's sample wheel. It will be used as an aid for interpreting later images that will show shapes of minuscule Martian soil particles.

    The area imaged by the microscope is 40 microns by 40 microns, small enough to fit on an eyelash. The grooves in this substrate are 14 microns (0.00055 inch) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nanometers (0.00001 inch) deep.

    This is the first atomic force microscope image recorded on another planet. It was taken on July 9, 2008, during the 44th Martian day, or sol, of the Phoenix mission since landing.

    Phoenix's Swiss-made atomic force microscope builds an image of the surface shape of a particle by sensing it with a sharp tip at the end of a spring, all microfabricated out of a silicon wafer. A strain gauge records how far the spring flexes to follow the contour of the surface. It can provide details of soil-particle shapes smaller than one-hundredth the width of a human hair. This is about 20 times smaller than what can be resolved with Phoenix's optical microscope, which has provided much higher-magnification imaging than anything seen on Mars previously. Both microscopes are part of Phoenix's Microscopy, Electrochemistry and Conductivity Analyzer.

  1. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

    NASA Astrophysics Data System (ADS)

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J.; Torun, Hamdi

    2016-06-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex.

  2. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments.

    PubMed

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J; Torun, Hamdi

    2016-01-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex. PMID:27273214

  3. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

    PubMed Central

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J.; Torun, Hamdi

    2016-01-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex. PMID:27273214

  4. High-speed atomic force microscopy for large scan sizes using small cantilevers

    NASA Astrophysics Data System (ADS)

    Braunsmann, Christoph; Schäffer, Tilman E.

    2010-06-01

    We present a high-speed atomic force microscope that exhibits a number of practical advantages over previous designs. Its central component is a high-speed scanner with a maximum scan size of 23 µm × 23 µm and a conveniently large sample stage area (6.5 mm × 6.5 mm). In combination with small cantilevers, image rates of up to 46 images s - 1 in air and 13 images s - 1 in liquid are reached under z-feedback control. By large scan size imaging of collagen fibrils in air, sample velocities of 8.8 mm s - 1 in the xy-direction and 11 mm s - 1 in the z-direction are reached. To provide optimized imaging conditions for both large and small scan sizes, a modular scanner design allows easily exchanging the x- and y-piezos. The scanner is therefore also suited for investigations on the molecular and atomic scale, which is demonstrated by imaging the step dynamics of a calcite surface during dissolution and the hexagonal lattice of a mica surface in liquid.

  5. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip.

    PubMed

    Felts, Jonathan R; Somnath, Suhas; Ewoldt, Randy H; King, William P

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s(-1) or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature. PMID:22551550

  6. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Felts, Jonathan R.; Somnath, Suhas; Ewoldt, Randy H.; King, William P.

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s-1 or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  7. Phase imaging of moving DNA molecules and DNA molecules replicated in the atomic force microscope.

    PubMed Central

    Argaman, M; Golan, R; Thomson, N H; Hansma, H G

    1997-01-01

    Phase imaging with a tapping mode atomic force microscope (AFM) has many advantages for imaging moving DNA and DNA-enzyme complexes in aqueous buffers at molecular resolution. In phase images molecules can be resolved at higher scan rates and lower forces than in height images from the AFM. Higher scan rates make it possible to image faster processes. At lower forces the molecules are imaged more gently. Moving DNA molecules are also resolved more clearly in phase images than in height images. Phase images in tapping mode AFM show the phase difference between oscillation of the piezoelectric crystal that drives the cantilever and oscillation of the cantilever as it interacts with the sample surface. Phase images presented here show moving DNA molecules that have been replicated with Sequenase in the AFM and DNA molecules tethered in complexes with Escherichia coli RNA polymerase. PMID:9336471

  8. Forced response of a cantilever beam with a dry friction damper attached. I - Theory. II - Experiment

    NASA Technical Reports Server (NTRS)

    Dowell, E. H.; Schwartz, H. B.

    1983-01-01

    A theoretical and experimental study of the forced vibration response of a cantilevered beam with Coulomb damping nonlinearity is described. Viscous damping in the beam is neglected. Beam and dry friction damper configurations of interest for applications to turbine blade vibrations are considered. It is shown that the basic phenomena found by Dowell (1983) for a simply supported beam with an attached dry friction damper of specific geometry also apply to a cantilevered beam and a more general representation of the dry friction damper and its associated mass and stiffness.

  9. Self-sensing atomic force microscopy cantilevers based on tunnel magnetoresistance sensors

    NASA Astrophysics Data System (ADS)

    Tavassolizadeh, Ali; Meier, Tobias; Rott, Karsten; Reiss, Günter; Quandt, Eckhard; Hölscher, Hendrik; Meyners, Dirk

    2013-04-01

    Here, we introduce self-sensing cantilevers for atomic force microscopy (AFM) based on tunnel magnetoresistance (TMR) sensors. These TMR sensors are integrated into the AFM cantilevers and consist of a magnetically stable layer and a sensing magnetostrictive CoFeB layer separated by a MgO tunneling barrier and can be as small as 10 μm × 10 μm. Their TMR values and resistance-area products are about 121% and 61 kΩμm2, respectively. A comparison of AFM data simultaneously obtained with a self-sensing cantilever with a 37 μm × 37 μm large TMR sensor and the conventional optical beam deflection method revealed the same data quality.

  10. Effect of Centrifugal Force on the Elastic Curve of a Vibrating Cantilever Beam

    NASA Technical Reports Server (NTRS)

    Simpkinson, Scott H; Eatherton, Laurel J; Millenson, Morton B

    1948-01-01

    A study was made to determine the effect of rotation on the dynamic-stress distribution in vibrating cantilever beams. The results of a mathematical analysis are presented together with experimental results obtained by means of stroboscopic photographs and strain gages. The theoretical analysis was confined to uniform cantilever beams; the experimental work was extended to include a tapered cantilever beam to simulate an aircraft propeller blade. Calculations were made on nondimensional basis for second and third mode vibration; the experiments were conducted on beams of various lengths, materials, and cross sections for second-mode vibration. From this investigation it was concluded that high vibratory-stress positions are unaffected by the addition of centrifugal force. Nonrotating vibration surveys of blades therefore are valuable in predicting high vibratory-stress locations under operating conditions.

  11. Fast atomic force microscopy with self-transduced, self-sensing cantilever

    NASA Astrophysics Data System (ADS)

    Ahmad, Ahmad; Ivanov, Tzvetan; Angelov, Tihomir; Rangelow, Ivo W.

    2015-07-01

    The conventional optical lever detection technique involves optical components and their precise mechanical alignment. An additional technical limit is the weight of the optical system in cases where a top-scanner is used with high-speed and high-precision metrology. An alternative represents the application of self-actuated atomic force microscopy (AFM) cantilevers with integrated two-dimensional electron gas (2-DEG) piezoresistive deflection sensors. A significant improvement in the performance of such cantilevers with respect to deflection sensitivity and temperature stability has been achieved by using an integrated Wheatstone bridge configuration. Due to employing effective crosstalk isolation and temperature drift compensation, the performance of these cantilevers was significantly improved. In order to enhance the speed of AFM measurements, we present an adaptive scanning speed procedure. Examples of AFM measurements with a high scanning speed (up to 200 lines/s) committed to advanced lithography process development are shown.

  12. Large deflections of a cantilever beam subjected to a follower force

    NASA Astrophysics Data System (ADS)

    Shvartsman, B. S.

    2007-07-01

    The large-deflection problem of a non-uniform spring-hinged cantilever beam under a tip-concentrated follower force is considered. The angle of inclination of the force with respect to the deformed axis of the beam remains unchanged during deformation. The mathematical formulation of this problem yields a nonlinear two-point boundary-value problem which is reduced to an initial-value problem by change of variables. The resulting problem can be solved without iterations. It is shown that there exist no critical loads in the Euler sense (divergence) for any flexural-stiffness distribution and angle of inclination of the follower force. The load-displacement characteristics of a uniform cantilever under a follower force normal to the deformed beam axis are presented.

  13. Atomic Force Microscope for Imaging and Spectroscopy

    NASA Technical Reports Server (NTRS)

    Pike, W. T.; Hecht, M. H.; Anderson, M. S.; Akiyama, T.; Gautsch, S.; deRooij, N. F.; Staufer, U.; Niedermann, Ph.; Howald, L.; Mueller, D.

    2000-01-01

    We have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.

  14. Imaging cells with the atomic force microscope.

    PubMed

    Butt, H J; Wolff, E K; Gould, S A; Dixon Northern, B; Peterson, C M; Hansma, P K

    1990-01-01

    Different types of cells have been imaged with the atomic force microscope. The morphology of the archaebacterium Halobacterium halobium in its dry state was revealed. On a leaf of the small Indian tree Lagerstroemia subcostata a stoma was imaged. The lower side of a water lily leaf was imaged in water showing features down to 12 nm. Finally, fixed red and white blood cells were imaged in buffer showing features down to 8 nm. The images demonstrate that atomic force microscopy can provide high-resolution images of cell surfaces under physiological conditions. PMID:2100150

  15. Dynamic nuclear polarization in a magnetic resonance force microscope experiment.

    PubMed

    Issac, Corinne E; Gleave, Christine M; Nasr, Paméla T; Nguyen, Hoang L; Curley, Elizabeth A; Yoder, Jonilyn L; Moore, Eric W; Chen, Lei; Marohn, John A

    2016-04-01

    We report achieving enhanced nuclear magnetization in a magnetic resonance force microscope experiment at 0.6 tesla and 4.2 kelvin using the dynamic nuclear polarization (DNP) effect. In our experiments a microwire coplanar waveguide delivered radiowaves to excite nuclear spins and microwaves to excite electron spins in a 250 nm thick nitroxide-doped polystyrene sample. Both electron and proton spin resonance were observed as a change in the mechanical resonance frequency of a nearby cantilever having a micron-scale nickel tip. NMR signal, not observable from Curie-law magnetization at 0.6 T, became observable when microwave irradiation was applied to saturate the electron spins. The resulting NMR signal's size, buildup time, dependence on microwave power, and dependence on irradiation frequency was consistent with a transfer of magnetization from electron spins to nuclear spins. Due to the presence of an inhomogeneous magnetic field introduced by the cantilever's magnetic tip, the electron spins in the sample were saturated in a microwave-resonant slice 10's of nm thick. The spatial distribution of the nuclear polarization enhancement factor ε was mapped by varying the frequency of the applied radiowaves. The observed enhancement factor was zero for spins in the center of the resonant slice, was ε = +10 to +20 for spins proximal to the magnet, and was ε = -10 to -20 for spins distal to the magnet. We show that this bipolar nuclear magnetization profile is consistent with cross-effect DNP in a ∼10(5) T m(-1) magnetic field gradient. Potential challenges associated with generating and using DNP-enhanced nuclear magnetization in a nanometer-resolution magnetic resonance imaging experiment are elucidated and discussed. PMID:26964007

  16. A scanning force microscope for simultaneous force and patch-clamp measurements on living cell tissues

    NASA Astrophysics Data System (ADS)

    Langer, M. G.; Öffner, W.; Wittmann, H.; Flösser, H.; Schaar, H.; Häberle, W.; Pralle, A.; Ruppersberg, J. P.; Hörber, J. K. H.

    1997-06-01

    For the investigation of mechanosensitive ion channels of living cells it is of great interest to apply very local forces in the piconewton range and to measure, simultaneously, ion currents down to 1 pA. Scanning force microscopy (SFM) is a suitable technique, that allows the application of such small forces with a lateral resolution in the range of 10 nm. We developed a novel type of experimental setup, because no existing SFM, home built or commercial, allows a simultaneous investigation of ion currents and mechanical properties of living cells. The construction consists of a SFM that is combined with an upright infrared differential interference contrast (DIC) video microscope and a conventional patch-clamp setup. Instead of the object, the force sensor is scanned to prevent relative movements between the patch pipette and the patched cell. The deflection of the SFM cantilever is detected with the so-called optical deflection method through the objective of the optical microscope. In opposite to common optical setups the laser beam was not focused on the force sensor. The presented optic creates a parallel laser beam between the objective and the SFM cantilever, which allows a vertical displacement of the sensor without any changes of the detector signal. For the three-dimensional positioning of the specimen chamber a two-axis translation stage including a vertical piezoelectric translation device was developed. The SFM tip is fixed on a combined lateral and vertical translation stage including a piezoelectric tube scanner for three-dimensional fine positioning. Thus the instrument enables an easy approach of the SFM tip to any optically identified cell structure. The head stage of the patch-clamp electronics and the patch pipette are directly fixed on the specimen stage. This prevents relative movements between patched cells and patch pipette during the approach to the SFM tip. The three-axis positioning of the patch pipette is done by a compact hydraulic

  17. Asymmetric post-flutter oscillations of a cantilever due to a dynamic follower force

    NASA Astrophysics Data System (ADS)

    Zamani, Vahid; Kharazmi, Ehsan; Mukherjee, Ranjan

    2015-03-01

    Flutter instability of a cantilever beam subjected to a follower force of constant magnitude is well understood: the beam oscillates with increasing amplitude when the force is larger than the critical load. Post-flutter analysis, similar to previous efforts, shows that the addition of damping results in steady-state oscillations. These oscillations are symmetric, but addition of a slope-dependent term to the magnitude of the follower force results in asymmetry. These asymmetric oscillations are investigated in this paper: the Ritz-Galerkin method is used to obtain a finite degree-of-freedom model of the cantilever and the method of multiple scales is used to analytically predict the amplitude and asymmetry of the oscillations. Numerical simulation results indicate a close match with analytically predicted results.

  18. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model. PMID:27420398

  19. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever

    NASA Astrophysics Data System (ADS)

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M.

    2016-09-01

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  20. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

    NASA Astrophysics Data System (ADS)

    Oral, A.; Grimble, R. A.; Özer, H. Ö.; Pethica, J. B.

    2003-08-01

    We describe a new, highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy. A novel fiber interferometer with ˜4×10-4 Å/√Hz noise level is employed to detect cantilever displacements. Subangstrom oscillation amplitude is applied to the lever at a frequency well below the resonance and changes in the oscillation amplitude due to tip-sample force interactions are measured with a lock-in amplifier. Quantitative force gradient images can be obtained simultaneously with the STM topography. Employment of subangstrom oscillation amplitudes lets us perform force-distance measurements, which reveal very short-range force interactions, consistent with the theory. Performance of the microscope is demonstrated with quantitative atomic resolution images of Si(111)(7×7) and force-distance curves showing short interaction range, all obtained with <0.25 Å lever oscillation amplitude. Our technique is not limited to UHV only and operation under liquids and air is feasible.

  1. Single DNA molecule grafting and manipulation using a combined atomic force microscope and an optical tweezer

    NASA Astrophysics Data System (ADS)

    Shivashankar, G. V.; Libchaber, A.

    1997-12-01

    In this letter, we report on spatially selecting and grafting a DNA-tethered bead to an atomic force microscope (AFM) cantilever, using an optical tweezer. To quantify this technique, we measure force versus extension of a single DNA molecule using AFM. For such studies, we have developed a micromanipulation approach by combining an AFM, an optical tweezer, and visualization setup. The ability to select a single DNA polymer and specifically graft it to a localized position on a substrate opens up new possibilities in biosensors and bioelectronic devices.

  2. Terabit-per-square-inch data storage with the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Cooper, E. B.; Manalis, S. R.; Fang, H.; Dai, H.; Matsumoto, K.; Minne, S. C.; Hunt, T.; Quate, C. F.

    1999-11-01

    An areal density of 1.6 Tbits/in.2 has been achieved by anodically oxidizing titanium with the atomic force microscope (AFM). This density was made possible by (1) single-wall carbon nanotubes selectively grown on an AFM cantilever, (2) atomically flat titanium surfaces on α-Al2O3 (1012), and (3) atomic scale force and position control with the tapping-mode AFM. By combining these elements, 8 nm bits on 20 nm pitch are written at a rate of 5 kbit/s at room temperature in air.

  3. Simulating atomic force microscope images with density functional theory: The role of nonclassical contributions to the force

    NASA Astrophysics Data System (ADS)

    Schaffhauser, Philipp; Kümmel, Stephan

    2016-07-01

    We discuss a scheme for calculating atomic force microscope images within the framework of density functional theory (DFT). As in earlier works [T. L. Chan et al., Phys. Rev. Lett. 102, 176101 (2009), 10.1103/PhysRevLett.102.176101; M. Kim and J. R. Chelikowsky, Appl. Surf. Sci. 303, 163 (2014), 10.1016/j.apsusc.2014.02.127] we do not simulate the cantilever explicitly, but consider it as a polarizable object. We go beyond previous studies by discussing the role of exchange and correlation effects; i.e., we approximately take into account the Pauli interaction between sample and cantilever. The good agreement that we find when comparing our calculated images to experimental images for the difficult case of the 8-hydroxyquinoline molecule demonstrates that exchange-correlation effects can play an important role in the DFT-based interpretation of AFM images.

  4. Closed-form solution for a cantilevered sectorial plate subjected to a tip concentrated force.

    PubMed

    Christy, Carl W; Weggel, David C; Smelser, R E

    2016-01-01

    A closed-form solution is presented for a cantilevered sectorial plate subjected to a tip concentrated force. Since the particular solution for this problem was not found in the literature, it is derived here. Deflections from the total solution (particular plus homogeneous solutions) are compared to those from a finite element analysis and are found to be in excellent agreement, producing an error within approximately 0.08 %. Normalized closed-form deflections and slopes at the fixed support, resulting from an approximate enforcement of the boundary conditions there, deviate from zero by <0.08 %. Finally, the total closed-form solutions for a cantilevered sectorial plate subjected to independent applications of a tip concentrated force, a tip bending moment, and a tip twisting moment, are compiled. PMID:27390653

  5. Long range metrological atomic force microscope with versatile measuring head

    NASA Astrophysics Data System (ADS)

    Lu, Mingzhen; Gao, Sitian; Li, Qi; Li, Wei; Shi, Yushu; Tao, Xingfu

    2013-01-01

    A long range metrological atomic force microscope (AFM) has been developed at NIM. It aims to realize a maximum measurement volume of 50mm×50mm×2mm with an uncertainty of a few tens of nanometers in the whole range. In compliance with Abbe Principle, the instrument is designed as a sample-scanning type. The sample is moved by a 6-DOF piezostage in combination with a hybrid slide-air bearing stage for long scanning range. Homodyne interferometers with four passes attached to a metrological frame measure relative displacement between the probe and sample thus the instrument is directly traceable to the SI. An AFM head is developed as the measuring head for the instrument. Considering accuracy and dynamic performance of the instrument, it is designed to be capable of scanning perpendicularly in a range of 5μm×5μm×5μm with a 3-DOF piezostage. Optical beam deflection method is used and a minimum of components are mounted on the moving part. A novel design is devised so that the photodetector is only sensitive to the deflection of cantilever, but not the displacement of the head. Moving manner of the head varies with scanning range and mode of the instrument. Results of different measurements are demonstrated, showing the excellent performance of the instrument.

  6. Sharp Tips on the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

    The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  7. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever

    NASA Astrophysics Data System (ADS)

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid.

  8. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever.

    PubMed

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid. PMID:23848696

  9. Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi

    2016-08-01

    In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. Both optical and mechanical detection techniques were adopted in SNOM to detect scattered light induced by the interaction of the PZT cantilever tip apex and evanescent light, and SNOM images were obtained for each detection scheme. The mechanical detection technique did allow for a clear observation of the light scattered from the PZT cantilever without the interference observed by the optical detection technique, which used an objective lens, a pinhole, and a photomultiplier tube.

  10. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers.

    PubMed

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations. PMID:26684144

  11. Modeling rectangular cantilevers during torsion and deflection for application to frictional force microscopy.

    PubMed

    Hayden, Victor C; Beaulieu, Luc Y

    2009-06-01

    A numerical and experimental analysis of the optical beam deflection system used to monitor microcantilevers subjected to simultaneous deflection and twisting such as in lateral or frictional force microscopy was performed. This study focused on two optical beam deflection orientations where in the first case the optical beam and the detector are at a right angle to the length of the cantilever and the second case, which is the more standard orientation, the optical beam is parallel to the length of the lever. This study finds that it is possible to model the twist and the deflection separately and treat each motion independently. Simulations have shown that the above-mentioned systems are equivalent in accuracy and sensitivity for monitoring the simultaneous twist and deflection of cantilevers. PMID:19460183

  12. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations.

  13. Uncertainty quantification in nanomechanical measurements using the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wagner, Ryan; Moon, Robert; Pratt, Jon; Shaw, Gordon; Raman, Arvind

    2011-11-01

    Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and biological surfaces and nanomaterials. We present a framework to ascribe uncertainty to local nanomechanical properties of any nanoparticle or surface measured with the AFM by taking into account the main uncertainty sources inherent in such measurements. We demonstrate the framework by quantifying uncertainty in AFM-based measurements of the transverse elastic modulus of cellulose nanocrystals (CNCs), an abundant, plant-derived nanomaterial whose mechanical properties are comparable to Kevlar fibers. For a single, isolated CNC the transverse elastic modulus was found to have a mean of 8.1 GPa and a 95% confidence interval of 2.7-20 GPa. A key result is that multiple replicates of force-distance curves do not sample the important sources of uncertainty, which are systematic in nature. The dominant source of uncertainty is the nondimensional photodiode sensitivity calibration rather than the cantilever stiffness or Z-piezo calibrations. The results underscore the great need for, and open a path towards, quantifying and minimizing uncertainty in AFM-based material property measurements of nanoparticles, nanostructured surfaces, thin films, polymers and biomaterials. This work is a partial contribution of the USDA Forest Service and NIST, agencies of the US government, and is not subject to copyright.

  14. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  15. Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

    NASA Astrophysics Data System (ADS)

    Yokoyama, Kousuke; Ochi, Taketoshi; Uchihashi, Takayuki; Ashino, Makoto; Sugawara, Yasuhiro; Suehira, Nobuhito; Morita, Seizo

    2000-01-01

    We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc-AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as Si(111)7×7, Cu(111), TiO2(110), and thymine/highly oriented pyrolytic graphite.

  16. Nanostethoscopy: A new mode of operation of the atomic force microscope

    SciTech Connect

    Keaton, A.; Holzrichter, J.F.; Balhorn, R.; Siekaus, W.J.

    1994-02-01

    The authors introduce a new mode of operation of the atomic force microscope (AFM). This detection scheme, a {open_quotes}Nano-Stethoscope{close_quotes}. Involves using the atomic force microscope in a novel acoustic mode not generally recognized. The Nano-Stethoscope uses the conventional scanning feature to locate a desired site, positions the AFM microscope tip over the site, holds the cantilever stationary (in x and v) and records the tip`s z-motion as a function of time. The tip/cantilever system thus functions as a micro-motion detector to respond to characteristic {open_quotes}pulsations{close_quotes}, nano-configurational chances, or any other event that influences the position of the tip as a function of time. The authors have demonstrated the feasibility of using the tip of an AFM in this manner in a biological system with a measurement of the vibrations of an emerging shrimp egg nauplius ({approximately}3 {mu}m. -10 Hz) and on the Angstrom scale in a non-biological system i.e.. the thermal expansion of metal interconnect lines on a microelectronic circuit.

  17. Internal resonance in forced vibration of coupled cantilevers subjected to magnetic interaction

    NASA Astrophysics Data System (ADS)

    Chen, Li-Qun; Zhang, Guo-Ce; Ding, Hu

    2015-10-01

    Forced vibration is investigated for two elastically connected cantilevers, under harmonic base excitation. One of the cantilevers is with a tip magnet repelled by a magnet fixed on the base. The cantilevers are uniform viscoelastic beams constituted by the Kelvin model. The system is formulated as a set of two linear partial differential equations with nonlinear boundary conditions. The method of multiple scales is developed to analyze the effects of internal resonances on the steady-state responses to external excitations in the nonlinear boundary problem of the partial differential equations. In the presence of 2:1 internal resonance, both the first and the second primary resonances are examined in detail. The analytical frequency-amplitude response relationships are derived from the solvability conditions. It is found that the frequency-amplitude response curves reveal typical nonlinear phenomena such as jumping and hysteresis in both primary resonances as well as saturation in the second primary resonance. The frequency-amplitude response curves may be converted from hardening-type single-jumping to double-jumpings, and further to softening-type single-jumping by adjusting the distance between two magnets. It is also found that the unstable parts of the frequency-amplitude response curves correspond to quasi-periodic motions. The finite difference scheme is proposed to discretize both the temporal and the spatial variables, and thus the numerical solutions can be calculated. The analytical results are supported by the numerical solutions.

  18. Direct calibration of colloidal probe cantilevers via Derjaguin, Landau, Verwey, and Overbeek surface forces in electrolyte solution

    NASA Astrophysics Data System (ADS)

    Hong, Xiaoting; Willing, Gerold A.

    2008-12-01

    The development of colloidal probe microscopy has made it possible to directly measure the interaction forces between two different surfaces in solution. Cantilever calibration is presently a subject of intense experimental and theoretical interest due to the need for accurate force measurement. We developed a novel and direct calibration method for colloidal probe cantilevers to which a silica microsphere has been previously attached based on fitting experimental force curves for the interaction between the silica sphere and a silica flat in dilute KBr solutions to the theoretical Derjaguin, Landau, Verwey, and Overbeek force curves using the measured zeta potential of the silica surfaces.

  19. ezAFM: A low cost Atomic Force Microscope(AFM)

    NASA Astrophysics Data System (ADS)

    Celik, Umit; Celik, Kubra; Aslan, Husnu; Kehribar, Ihsan; Dede, Munir; Ozgur Ozer, H.; Oral, Ahmet

    2012-02-01

    A low cost AFM, ezAFM is developed for educational purposes as well as research. Optical beam deflection method is used to measure the deflection of cantilever. ezAFM scanner is built using voice coil motors (VCM) with ˜50x50x6 μm scan area. The microscope uses alignment free cantilevers, which minimizes setup times. FPGA based AFM feedback Control electronics is developed. FPGA technology allows us to drive all peripherals in parallel. ezAFM Controller is connected to PC by USB 2.0 interface as well as Wi-Fi. We have achieved <5nm lateral and ˜0.01nm vertical resolution. ezAFM can image single atomic steps in HOPG and mica. An optical microscope with <3 μm resolution is also integrated into the system. ezAFM supports different AFM operation modes such as dynamic mode, contact mode, lateral force microscopy. Advanced modes like magnetic force microscopy and electric force microscopy will be implemented later on. The new ezAFM system provides, short learning times for student labs, quick setup and easy to transport for portable applications with the best price/performance ratio. The cost of the system starts from 15,000, with system performance comparable with the traditional AFM systems.

  20. Dynamically forced cantilever system: A piezo-polymer characterization tool with possible application for micromechanical HF resonator devices

    SciTech Connect

    Schwoediauer, Reinhard

    2005-04-01

    A cantilever system, driven to a dynamically forced oscillation by a small piezoelectric specimen is presented as a simple and accurate tool to determine the converse dynamic piezocoefficient up to several kHz. The piezoelectric sample is mounted on top of a reflective cantilever where it is free to oscillate without any mechanical constraint. A Nomarsky-interferometer detects the induced cantilever displacement. The presented technique is especially suited for a precise characterization of small and soft piezoelectric polymer-samples with rough surfaces. The capability of the dynamically forced cantilever principle is demonstrated with a LiNbO{sub 3} crystal and with a porous ferroelectretic polypropylene foam. Results from measurements between 400 Hz and 5 kHz were found to be in excellent agreement with published values. Additionally, the dynamically forced cantilever principle may possibly improve the sensitivity of some micromechanical cantilever-sensors and it could also be interesting for the design of enhanced micromechanical high frequency mixer filters. Some ideas about are briefly presented.

  1. Surface science experiments involving the atomic force microscope

    NASA Astrophysics Data System (ADS)

    McBride, Sean P.

    Three diverse first author surfaces science experiments conducted by Sean P. McBride1-3 will be discussed in detail and supplemented by secondary co-author projects by Sean P. McBride,4-7 all of which rely heavily on the use of an atomic force microscope (AFM). First, the slip length parameter, b of liquids is investigated using colloidal probe AFM. The slip length describes how easily a fluid flows over an interface. The slip length, with its exact origin unknown and dependencies not overwhelming decided upon by the scientific community, remains a controversial topic. Colloidal probe AFM uses a spherical probe attached to a standard AFM imaging tip driven through a liquid. With the force on this colloidal AFM probe known, and using the simplest homologous series of test liquids, many of the suspected causes and dependencies of the slip length demonstrated in the literature can be suppressed or eliminated. This leaves the measurable trends in the slip length attributed only to the systematically varying physical properties of the different liquids. When conducting these experiments, it was realized that the spring constant, k, of the system depends upon the cantilever geometry of the experiment and therefore should be measured in-situ. This means that the k calibration needs to be performed in the same viscous liquid in which the slip experiments are performed. Current in-situ calibrations in viscous fluids are very limited, thus a new in-situ k calibration method was developed for use in viscous fluids. This new method is based upon the residuals, namely, the difference between experimental force-distance data and Vinogradova slip theory. Next, the AFM's ability to acquire accurate sub nanometer height profiles of structures on interfaces was used to develop a novel experimental technique to measure the line tension parameter, tau, of isolated nanoparticles at the three phase interface in a solid-liquid-vapor system. The tau parameter is a result of excess energy

  2. A metrological large range atomic force microscope with improved performance

    NASA Astrophysics Data System (ADS)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-01

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  3. A metrological large range atomic force microscope with improved performance

    SciTech Connect

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-15

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  4. A metrological large range atomic force microscope with improved performance.

    PubMed

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-01

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument. PMID:19405661

  5. Model based control of dynamic atomic force microscope

    SciTech Connect

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  6. Model based control of dynamic atomic force microscope.

    PubMed

    Lee, Chibum; Salapaka, Srinivasa M

    2015-04-01

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H(∞) control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments. PMID:25933864

  7. Measurement of interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} and immobilized vitronectin on the cantilever tip

    SciTech Connect

    Lee, Minsu; Yang, Hyun-Kyu; Park, Keun-Hyung; Kang, Dong-Ku; Chang, Soo-Ik Kang, In-Cheol

    2007-11-03

    Protein nanoarrays containing integrin {alpha}{sub v}{beta}{sub 3} or BSA were fabricated on ProLinker{sup TM}-coated Au surface by dip-pen nanolithography (DPN). An atomic force microscope (AFM) tip coated with ProLinker{sup TM} was modified by vitronectin. We measured the interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} or BSA and immobilized vitronectin on the cantilever tip by employing tethering-unbinding method. The unbinding force between integrin {alpha}{sub v}{beta}{sub 3} and vitronectin (1087 {+-} 62 pN) was much higher than that of between BSA and vitronectin (643 {+-} 74 pN). These results demonstrate that one can distinguish a specific protein interaction from non-specific interactions by means of force measurement on the molecular interactions between the nanoarrayed protein and its interacting protein on the AFM tip.

  8. Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor

    NASA Astrophysics Data System (ADS)

    Giessibl, F. J.; Hembacher, S.; Herz, M.; Schiller, Ch; Mannhart, J.

    2004-02-01

    In frequency modulation atomic force microscopy, the stiffness, quality factor and oscillation amplitude of the cantilever are important parameters. While the first atomic resolution results were obtained with amplitudes of a few hundred ångstrom, it has subsequently been shown that smaller amplitudes should result in a better signal-to-noise ratio and an increased sensitivity to the short-range components of the tip-sample interaction. Stable oscillation at small amplitudes is possible if the product of stiffness and amplitude and the energy stored in the oscillating cantilever are large enough. For small amplitudes, stability can be achieved by using stiff cantilevers. Here, we discuss the physical requirements for small amplitude operation and present design criteria and technical details of the qPlus sensor, a self-sensing cantilever with large stiffness that allows small amplitude operation.

  9. Nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Ewoldt, Randy; Felts, Jonathan; Somnath, Suhas; King, William

    2012-11-01

    We experimentally investigate nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever, a nanofabrication process known as thermal dip-pen nanolithography (tDPN). Fluid is deposited from the AFM tip onto non-porous substrates whether the tip is moving or fixed. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. Additionally, the flow rate increases when a temperature gradient exists between the tip and substrate. We hypothesize that the polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  10. Comparison of Paramagnetic and Ferromagnetic Resonance Imaging with an Improved Magnetic Resonance Force Microscope

    NASA Astrophysics Data System (ADS)

    Wago, K.; Botkin, D.; Yannoni, C. S.; Rugar, D.

    1998-03-01

    A magnetic resonance force microscope with an improved ``tip-on-cantilever'' configuration was used to compare imaging characteristics of paramagnetic and ferromagnetic samples. Three-dimensional electron paramagnetic resonance (EPR) imaging of diphenylpicrylhydrazil (DPPH) particles was accomplished by scanning the sample in two dimensions while stepping an external field. The EPR force map showed broad response reflecting the size and shape of the sample, allowing a three-dimensional real-space magnetization image to be successfully reconstructed. In contrast to the EPR case, ferromagnetic resonance (FMR) imaging of a micron-scale yttrium iron garnet (YIG) sample showed no significant line broadening despite the strong field gradient ( ~ 10 G/μm). Two-dimensional force maps revealed spatial dependence of magnetostatic and magnetoelastic modes.

  11. Measuring Energies at the Nanometer-Scale of Molecular Organic Materials with an Atomic Force Microscope: TTF-TCNQ as a Case Study

    NASA Astrophysics Data System (ADS)

    Fraxedas, J.; Langer, J.; Díez, I.; Sanz, F.

    2006-02-01

    The elastic response of molecular organic materials to external mechanical nanoindentations in the nano- and low micronewton force range can be characterized using ultrasharp cantilever tips of an Atomic Force Microscope (AFM). Because clear distinction between elastic and plastic deformation is achieved, the maximal accumulated elastic energy can be directly determined from the force vs. penetration curves, giving an estimate of the characteristic energies of the materials.

  12. Measurement of GHz range magnetic field distribution near a coplanar waveguide using a beating field-type magnetic force microscope

    NASA Astrophysics Data System (ADS)

    Endo, Y.; Fukushima, M.; Arai, K.; Yanagi, K.; Shimada, Y.; Yamaguchi, M.

    2014-05-01

    This paper describes the measurement of microscopic radio frequency (RF) field distribution with a magnetic force microscope (MFM) tip exploring the beat signal from a coplanar waveguide (CPW) with a signal line as fine as 5 μm and a ground line of 50 μm. To produce a beating field in close proximity to the CPW, two RF currents with slightly different frequencies are supplied, where one is the signal current with a fixed frequency of 1.1 GHz and the other is the reference. The reference is adjusted to produce a beat with a frequency near the cantilever mechanical resonance frequency. Thus, the mechanical resonance of the cantilever excited by the beat field includes information about the 1.1 GHz field distribution from the CPW signal current. Detection of a beating field with a MFM tip can provide very high resolutions of the RF field distribution in the proximity of RF circuit component.

  13. Physical microscopic model of proteins under force.

    PubMed

    Dokholyan, Nikolay V

    2012-06-14

    Nature has evolved proteins to counteract forces applied on living cells, and has designed proteins that can sense forces. One can appreciate Nature's ingenuity in evolving these proteins to be highly sensitive to force and to have a high dynamic force range at which they operate. To achieve this level of sensitivity, many of these proteins are composed of multiple domains and linking peptides connecting these domains, each of them having their own force response regimes. Here, using a simple model of a protein, we address the question of how each individual domain responds to force. We also ask how multidomain proteins respond to forces. We find that the end-to-end distance of individual domains under force scales linearly with force. In multidomain proteins, we find that the force response has a rich range: at low force, extension is predominantly governed by "weaker" linking peptides or domain intermediates, while at higher force, the extension is governed by unfolding of individual domains. Overall, the force extension curve comprises multiple sigmoidal transitions governed by unfolding of linking peptides and domains. Our study provides a basic framework for the understanding of protein response to force, and allows for interpretation experiments in which force is used to study the mechanical properties of multidomain proteins. PMID:22375559

  14. Optimizing 1-μs-Resolution Single-Molecule Force Spectroscopy on a Commercial Atomic Force Microscope.

    PubMed

    Edwards, Devin T; Faulk, Jaevyn K; Sanders, Aric W; Bull, Matthew S; Walder, Robert; LeBlanc, Marc-Andre; Sousa, Marcelo C; Perkins, Thomas T

    2015-10-14

    Atomic force microscopy (AFM)-based single-molecule force spectroscopy (SMFS) is widely used to mechanically measure the folding and unfolding of proteins. However, the temporal resolution of a standard commercial cantilever is 50-1000 μs, masking rapid transitions and short-lived intermediates. Recently, SMFS with 0.7-μs temporal resolution was achieved using an ultrashort (L = 9 μm) cantilever on a custom-built, high-speed AFM. By micromachining such cantilevers with a focused ion beam, we optimized them for SMFS rather than tapping-mode imaging. To enhance usability and throughput, we detected the modified cantilevers on a commercial AFM retrofitted with a detection laser system featuring a 3-μm circular spot size. Moreover, individual cantilevers were reused over multiple days. The improved capabilities of the modified cantilevers for SMFS were showcased by unfolding a polyprotein, a popular biophysical assay. Specifically, these cantilevers maintained a 1-μs response time while eliminating cantilever ringing (Q ≅ 0.5). We therefore expect such cantilevers, along with the instrumentational improvements to detect them on a commercial AFM, to accelerate high-precision AFM-based SMFS studies. PMID:26421945

  15. Single Dimer E-Cadherin Interaction Forces Characterized Using Modified AFM Cantilevers

    NASA Astrophysics Data System (ADS)

    Rudnitsky, Robert; Drees, Frauke; Nelson, W. James; Kenny, Thomas

    2002-03-01

    In tissue monolayers, adhesion between cells is accomplished chiefly through the action of [Ca++] dependent cadherin proteins. E-cadherin molecules coalesce into large plaques on contacting membranes of adjacent cells. Using specialized AFM cantilevers functionalized with tethered E-cadherin proteins, we studied the interaction forces of trans dimers from the single bond level through to the higher surface densities found in plaques, with pico-Newton force resolution. The measurements demonstrated the dependence of E-cadherin homoassociation on surface protein density. Previous in-vivo studies established the role of Ca++ in E-cadherin adhesion in whole cells. Advances in AFM force spectroscopy allowed us to characterize the unbinding process under force loads, and to differentiate single and multiple molecular binding events. The data correlates the dependence of E-cadherin adhesion at a molecular level to [Ca++], revealing interaction details that cannot be observed using whole-cell studies. This work is supported by NSF (XYZ on a Chip Program) CMS-9980838, NIH (GMB5227), and the Fannie and John Hertz Foundation.

  16. Tip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments.

    PubMed

    Shih, Hua-Ju; Shih, Po-Jen

    2015-01-01

    Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. Studies have noted that the heights of protein surfaces measured via the tapping mode of an atomic force microscope are ~25% smaller than those measured by other methods. This discrepancy may be attributable to the induced superficial hydrodynamic pressure, which is worth investigating. In this paper, we introduce a semi-analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone-shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is 20 times larger than the pressure without considering the tip effect; these results have not been motioned in other papers. Dominating factors, such as surface heights of protein surface, mechanical stiffness of protein increasing with loading velocity, and radius of tip affecting the local pressure of specimen, are also addressed in this study. PMID:26225979

  17. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    SciTech Connect

    Liu Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-15

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  18. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    NASA Astrophysics Data System (ADS)

    Liu, Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-01

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  19. Probing mechanical properties of living cells by atomic force microscopy with blunted pyramidal cantilever tips.

    PubMed

    Rico, Félix; Roca-Cusachs, Pere; Gavara, Núria; Farré, Ramon; Rotger, Mar; Navajas, Daniel

    2005-08-01

    Atomic force microscopy (AFM) allows the acquisition of high-resolution images and the measurement of mechanical properties of living cells under physiological conditions. AFM cantilevers with blunted pyramidal tips are commonly used to obtain images of living cells. Measurement of mechanical properties with these tips requires a contact model that takes into account their blunted geometry. The aim of this work was to develop a contact model of a blunted pyramidal tip and to assess the suitability of pyramidal tips for probing mechanical properties of soft gels and living cells. We developed a contact model of a blunted pyramidal tip indenting an elastic half-space. We measured Young's modulus (E) and the complex shear modulus (G*= G' +i G" ) of agarose gels and A549 alveolar epithelial cells with pyramidal tips and compared them with those obtained with spherical tips. The gels exhibited an elastic behavior with almost coincident loading and unloading force curves and negligible values of G". E fell sharply with indentation up to approximately 300 nm , showing a linear regime for deeper indentations. A similar indentation dependence of E with twofold lower values at the linear regime was obtained with the spherical tip fitted with Hertz's model. The dependence of E on indentation in cells paralleled that found in gels. Cells exhibited viscoelastic behavior with G"/G' approximately 1/4 . Pyramidal tips commonly used for AFM imaging are suitable for probing mechanical properties of soft gels and living cells. PMID:16196611

  20. Understanding interferometry for micro-cantilever displacement detection

    PubMed Central

    Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Summary Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber–cantilever configurations. In the Fabry–Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. PMID:27547601

  1. Understanding interferometry for micro-cantilever displacement detection.

    PubMed

    von Schmidsfeld, Alexander; Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions. PMID:27547601

  2. Construction of a 3He magnetic force microscope with a vector magnet

    NASA Astrophysics Data System (ADS)

    Yang, Jinho; Yang, Ilkyu; Kim, Yun Won; Shin, Dongwoo; Jeong, Juyoung; Wulferding, Dirk; Yeom, Han Woong; Kim, Jeehoon

    2016-02-01

    We constructed a 3He magnetic force microscope operating at the base temperature of 300 mK under a vector magnetic field of 2-2-9 T in the x-y-z direction. Fiber optic interferometry as a detection scheme is employed in which two home-built fiber walkers are used for the alignment between the cantilever and the optical fiber. The noise level of the laser interferometer is close to its thermodynamic limit. The capabilities of the sub-Kelvin and vector field are demonstrated by imaging the coexistence of magnetism and superconductivity in a ferromagnetic superconductor (ErNi2B2C) at T = 500 mK and by probing a dipole shape of a single Abrikosov vortex with an in-plane tip magnetization.

  3. Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach

    SciTech Connect

    Wang, Yuliang Bi, Shusheng; Wang, Huimin

    2014-05-15

    Drift has long been an issue in atomic force microscope (AFM) systems and limits their ability to make long time period measurements. In this study, a new method is proposed to directly measure and compensate for the drift between AFM cantilevers and sample surfaces in AFM systems. This was achieved by simultaneously measuring z positions for beads at the end of an AFM colloidal probe and on sample surface through an off-focus image processing based visual sensing method. The working principle and system configuration are presented. Experiments were conducted to validate the real time drift measurement and compensation. The implication of the proposed method for regular AFM measurements is discussed. We believe that this technique provides a practical and efficient approach for AFM experiments requiring long time period measurement.

  4. Atomic force microscope, molecular imaging, and analysis.

    PubMed

    Chen, Shu-wen W; Teulon, Jean-Marie; Godon, Christian; Pellequer, Jean-Luc

    2016-01-01

    Image visibility is a central issue in analyzing all kinds of microscopic images. An increase of intensity contrast helps to raise the image visibility, thereby to reveal fine image features. Accordingly, a proper evaluation of results with current imaging parameters can be used for feedback on future imaging experiments. In this work, we have applied the Laplacian function of image intensity as either an additive component (Laplacian mask) or a multiplying factor (Laplacian weight) for enhancing image contrast of high-resolution AFM images of two molecular systems, an unknown protein imaged in air, provided by AFM COST Action TD1002 (http://www.afm4nanomedbio.eu/), and tobacco mosaic virus (TMV) particles imaged in liquid. Based on both visual inspection and quantitative representation of contrast measurements, we found that the Laplacian weight is more effective than the Laplacian mask for the unknown protein, whereas for the TMV system the strengthened Laplacian mask is superior to the Laplacian weight. The present results indicate that a mathematical function, as exemplified by the Laplacian function, may yield varied processing effects with different operations. To interpret the diversity of molecular structure and topology in images, an explicit expression for processing procedures should be included in scientific reports alongside instrumental setups. PMID:26224520

  5. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips.

    PubMed

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    This paper deals with an application of 3D finite element analysis to the electrostatic interaction between (i) a commercial rectangular shaped cantilever (with an integrated anisotropic pyramidal tip) and a conductive sample, when a voltage difference is applied between them, and (ii) a focused ion beam (FIB) modified cantilever in order to realize a probe with reduced parasitic electrostatic force. The 3D modelling of their electrostatic deflection was realized by using multiphysics finite element analysis software and applied to the real geometry of the cantilevers and probes as used in conventional electric and Kelvin force microscopy to evaluate the contribution of the various part of a cantilever to the total force, and derive practical criteria to optimize the probe performances. We report also on the simulation of electrostatic shielding of nanometric features, in order to quantitatively evaluate an alternative way of reducing the systematic error caused by the cantilever-to-sample capacitive coupling. Finally, a quantitative comparison between the performances of rectangular and triangular cantilevers (part I of this work) is reported. PMID:21832618

  6. Atomic force microscope based near-field imaging for probing cell surface interactions

    NASA Astrophysics Data System (ADS)

    Amini, Sina

    Near-membrane and trans-membrane proteins and their interactions with the extracellular matrix (ECM) can yield valuable information about cell dynamics. However, advances in the field of nanoscale cellular processes have been hindered, in part, due to limits imposed by current technology. In this work, a novel evanescent field (EF) imaging technique is designed, modeled, created and tested for near-field imaging in the apical surface of cells. This technique and Forster resonance energy transfer (FRET) were used to investigate interactions between integrins on the cell surface and the ECM protein, fibronectin. The goal was to monitor changes in the integrin density at the cell surface as a function of clustering after binding to fibronectin on the microsphere surface. For the EF technique, quantum dot (QD)-embedded polystyrene microspheres were used to couple light into whispering gallery modes (WGMs) inside the microspheres; the resulting EF at the surface of the microsphere was used as a near-field excitation source with ~50 nm axial resolution for exciting fluorescently-labeled integrins. For FRET measurements (~10 nm axial resolution), QDs (donors) were coated on the surface of microspheres and energy transfer to red fluorescent protein (RFP)-integrin constructs (acceptors) studied. In both techniques, the QD-modified microspheres were mounted on atomic force microscope (AFM) cantilevers, functionalized with fibronectin, and brought into contact with fluorescently-labeled HeLa or vascular smooth muscle (VSM) cells. The results obtained from both methods show the clustering and activity of the integrins and are in good agreement with each other. Amsterdam discrete dipole approximation (ADDA) was used to study the effects of inhomogeneous surrounding refractive index on the quality factor and position of the WGMs due to the attachment of a microsphere to an AFM cantilever. WGMs of various QD-embedded microspheres mounted on AFM cantilevers were experimentally

  7. Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies.

    PubMed

    Fukuma, T; Onishi, K; Kobayashi, N; Matsuki, A; Asakawa, H

    2012-04-01

    In this study, we have investigated the performance of liquid-environment FM-AFM with various cantilevers having different dimensions from theoretical and experimental aspects. The results show that reduction of the cantilever dimensions provides improvement in the minimum detectable force as long as the tip height is sufficiently long compared with the width of the cantilever. However, we also found two important issues to be overcome to achieve this theoretically expected performance. The stable photothermal excitation of a small cantilever requires much higher pointing stability of the exciting laser beam than that for a long cantilever. We present a way to satisfy this stringent requirement using a temperature controlled laser diode module and a polarization-maintaining optical fiber. Another issue is associated with the tip. While a small carbon tip formed by electron beam deposition (EBD) is desirable for small cantilevers, we found that an EBD tip is not suitable for atomic-scale applications due to the weak tip-sample interaction. Here we show that the tip-sample interaction can be greatly enhanced by coating the tip with Si. With these improvements, we demonstrate atomic-resolution imaging of mica in liquid using a small cantilever with a megahertz-order resonance frequency. In addition, we experimentally demonstrate the improvement in the minimum detectable force obtained by the small cantilever in measurements of oscillatory hydration forces. PMID:22421199

  8. Photothermal excitation setup for a modified commercial atomic force microscope

    SciTech Connect

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika; Kobayashi, Kei; Yamada, Hirofumi

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  9. Photothermal excitation setup for a modified commercial atomic force microscope

    NASA Astrophysics Data System (ADS)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kobayashi, Kei; Yamada, Hirofumi; Kühnle, Angelika

    2014-02-01

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/sqrt{Hz} measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  10. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips

    NASA Astrophysics Data System (ADS)

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    The investigation of the nanoscale distribution of electrostatic forces on material surfaces is of paramount importance for the development of nanotechnology, since these confined forces govern many physical processes on which a large number of technological applications are based. For instance, electric force microscopy (EFM) and micro-electro-mechanical-systems (MEMS) are technologies based on an electrostatic interaction between a cantilever and a specimen. In the present work we report on a 3D finite element analysis of the electrostatic deflection of cantilevers for electric and Kelvin force microscopy. A commercial triangular shaped cantilever with a symmetric pyramidal tip was modelled. In addition, the cantilever was modified by a focused ion beam (FIB) in order to reduce its parasitic electrostatic force, and its behaviour was studied by computation analysis. 3D modelling of the electrostatic deflection was realized by using a multiphysics finite element analysis software and it was applied to the real geometry of the cantilevers and probes obtained by using basic CAD tools. The results of the modelling are in good agreement with experimental data.

  11. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips.

    PubMed

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    The investigation of the nanoscale distribution of electrostatic forces on material surfaces is of paramount importance for the development of nanotechnology, since these confined forces govern many physical processes on which a large number of technological applications are based. For instance, electric force microscopy (EFM) and micro-electro-mechanical-systems (MEMS) are technologies based on an electrostatic interaction between a cantilever and a specimen. In the present work we report on a 3D finite element analysis of the electrostatic deflection of cantilevers for electric and Kelvin force microscopy. A commercial triangular shaped cantilever with a symmetric pyramidal tip was modelled. In addition, the cantilever was modified by a focused ion beam (FIB) in order to reduce its parasitic electrostatic force, and its behaviour was studied by computation analysis. 3D modelling of the electrostatic deflection was realized by using a multiphysics finite element analysis software and it was applied to the real geometry of the cantilevers and probes obtained by using basic CAD tools. The results of the modelling are in good agreement with experimental data. PMID:21832617

  12. Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid

    SciTech Connect

    Nishida, Shuhei; Kobayashi, Dai; Sakurada, Takeo; Nakazawa, Tomonori; Hoshi, Yasuo; Kawakatsu, Hideki

    2008-12-15

    The authors present an optically based method combining photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid. The frequency spectrum of a silicon cantilever measured in water over frequencies ranging up to 10 MHz shows that the method allows us to excite and detect higher modes, from fundamental to fifth flexural, without enhancing spurious resonances. By reducing the tip oscillation amplitude using higher modes, the average tip-sample force gradient due to chemical bonds is effectively increased to achieve high-spatial-resolution imaging in liquid. The method's performance is demonstrated by atomic resolution imaging of a mica surface in water obtained using the second flexural mode with a small tip amplitude of 99 pm; individual atoms on the surface with small height differences of up to 60 pm are clearly resolved.

  13. Scanning Capacitace Microscope/Atomic Force Microscope/Scanning Tunneling Microscope Study of Ion-Implanted Silicon Surfaces

    NASA Astrophysics Data System (ADS)

    Tomiye, Hideto; Kawami, Hiroshi; Izawa, Michiyoshi; Yoshimura, Masamichi; Yao, Takafumi

    1995-06-01

    We have investigated the local electrical properties of ion-implanted Si using a combined scanning capacitance microscope (SCaM)/atomic force microscope (AFM)/scanning tunneling microscope (STM) with special attention paid to the effect of annealing. The STM image shows that the as-implanted area is insulating, while the unimplanted area is conductive, in an unannealed sample. Both STM and SCaM images clearly indicate that the implanted area is conductive with n-type behavior after annealing. However, the unimplanted area did not show p-type behavior but slightly n-type behavior due to the diffusion of P impurities during annealing.

  14. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

    DOE PAGESBeta

    Borysov, Stanislav S.; Forchheimer, Daniel; Haviland, David B.

    2014-10-29

    Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

  15. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    NASA Astrophysics Data System (ADS)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  16. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    SciTech Connect

    Baumann, Fabian; Pippig, Diana A. Gaub, Hermann E.; Heucke, Stephan F.

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  17. Effect of cantilever nonlinearity in nanoscale tensile testing

    NASA Astrophysics Data System (ADS)

    Ding, Weiqiang; Guo, Zaoyang; Ruoff, Rodney S.

    2007-02-01

    Microcantilevers are widely used in micro-/nanoscale mechanics studies. The nonlinear response of a cantilever at large deflection is sometimes overlooked. A general study of cantilever beam nonlinearity under a variety of loading conditions was performed with analytical and finite element analyses. Analytical equations for the applied load and the cantilever deflection were obtained. The cantilever nonlinearity was found to increase with increasing cantilever deflection and/or angle of loading. Tensile tests were performed on templated carbon nanotubes (TCNTs) with a custom-made nanomanipulator inside a scanning electron microscope. Atomic force microscope (AFM) cantilevers were used to load the TCNTs and sense the force. During the tests the AFM cantilevers were loaded to relatively large deflections with nonvertical loads applied at the AFM tip. Based on the slope and the loading angle measurements, the breaking forces of the TCNTs were obtained through numerical integration of the analytical equations. A comparison was made between the load results obtained from linear and nonlinear analyses. The linear analysis was found to underestimate the applied load by up to 15%.

  18. Development of the magnetic force-induced dual vibration energy harvester using a unimorph cantilever

    NASA Astrophysics Data System (ADS)

    Umaba, M.; Nakamachi, E.; Morita, Y.

    2015-12-01

    In this study, a high frequency piezoelectric energy harvester converted from the human low vibrated motion energy was newly developed. This hybrid energy harvester consists of the unimorph piezoelectric cantilever, the pendulum and a pair of permanent magnets. One magnet was attached at the edge of cantilever, and the counterpart magnet at the edge of pendulum. The mechanical energy provided through the human walking motion, which is a typical ubiquitous existence of vibration, is converted to the electric energy via the piezoelectric unimorph cantilever vibration. At first, we studied the energy convert mechanism and analyze the performance of novel energy harvester, where the resonance free vibration of unimorph piezoelectric cantilever generated a high electric power. Next, we equipped the counterpart permanent magnet at the edge of pendulum, which vibrates with a very low frequency caused by the human walking. Then the counterpart magnet was set at the edge of unimorph piezoelectric cantilever, which vibrated with a high frequency. This low-to-high frequency convert "dual vibration system" can be characterized as an enhanced energy harvester. We examined and obtained average values of voltage and power in this system, as 8.31 mV and 0.33 μW. Those results show the possibility to apply for the energy harvester in the portable and implantable Bio-MEMS devices.

  19. Study of adhesive forces on a silicon nanotip by atomic force microscope in contact mode

    NASA Astrophysics Data System (ADS)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-04-01

    Atomic Force Microscope operating in contact mode is used in this paper for probing the spatial distribution of adhesive forces versus the topography of a silicon nanotip. This nanotip consists in an ultra sha4rp silicon tip with radius less than 15 nm fabricated using a combination of high- resolution electron beam lithography and plasma dry etching. The amplitude of the forces is determined from force versus distance curve measurements. Hence, by determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This paper reports both measurements and the modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has got a smaller aperture angle than the employed Atomic Force Microscope tip, the measurements are focused on the nanotip apex.

  20. Adhesive forces investigation on a silicon tip by contact-mode atomic force microscope

    NASA Astrophysics Data System (ADS)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-09-01

    An atomic force microscope operating in contact mode is used in this letter for probing the adhesive forces at the apex of a silicon nanotip with typical radius smaller than 15 nm, fabricated using a combination of high-resolution electron beam lithography and plasma dry etching. The amplitude of the forces is deduced from force versus distance curve measurements. By determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This letter reports both measurements and modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has a smaller aperture angle than the employed atomic force microscope tip, the measurements are focused on the nanotip apex.

  1. Magnetic resonance force microscopy with a permanent magnet on the cantilever

    SciTech Connect

    Zhang, Z.; Hammel, P.C.

    1997-02-01

    The magnetic resonance force microscope (MRFM) is a microscopic 3-D imaging instrument based on a recent proposal to detect magnetic resonance signals mechanically using a micro-mechanical resonator. MRFM has been successfully demonstrated in various magnetic resonance experiments including electron spin resonance, ferromagnetic resonances and nuclear magnetic resonance. In order to apply this ultra-high, 3-D spatial resolution technique to samples of arbitrary size and shape, the magnetic particle which generates the field gradient {del}{bold B}, (and, therefore, the force {bold F = (m {center_dot} {del}B)} between itself and the spin magnetization {bold m} of the sample) will need to be mounted on the mechanical resonator. Up to the present, all experiments have been performed with the sample mounted on the resonator. This is done, in part, to avoid the spurious response of the mechanical resonator which is generated by the variation of the magnetization of the magnetic particle as the external field is varied.

  2. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  3. Spanning the scales of granular materials through microscopic force imaging

    NASA Astrophysics Data System (ADS)

    Brodu, Nicolas; Dijksman, Joshua A.; Behringer, Robert P.

    2015-03-01

    If you walk on sand, it supports your weight. How do the disordered forces between particles in sand organize, to keep you from sinking? This simple question is surprisingly difficult to answer experimentally: measuring forces in three dimensions, between deeply buried grains, is challenging. Here we describe experiments in which we have succeeded in measuring forces inside a granular packing subject to controlled deformations. We connect the measured micro-scale forces to the macro-scale packing force response with an averaging, mean field calculation. This calculation explains how the combination of packing structure and contact deformations produce the observed nontrivial mechanical response of the packing, revealing a surprising microscopic particle deformation enhancement mechanism.

  4. Spanning the scales of granular materials through microscopic force imaging

    PubMed Central

    Brodu, Nicolas; Dijksman, Joshua A.; Behringer, Robert P.

    2015-01-01

    If you walk on sand, it supports your weight. How do the disordered forces between particles in sand organize, to keep you from sinking? This simple question is surprisingly difficult to answer experimentally: measuring forces in three dimensions, between deeply buried grains, is challenging. Here we describe experiments in which we have succeeded in measuring forces inside a granular packing subject to controlled deformations. We connect the measured micro-scale forces to the macro-scale packing force response with an averaging, mean field calculation. This calculation explains how the combination of packing structure and contact deformations produce the observed nontrivial mechanical response of the packing, revealing a surprising microscopic particle deformation enhancement mechanism. PMID:25739968

  5. Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry

    PubMed Central

    Guo, Tong; Wang, Siming; Dorantes-Gonzalez, Dante J.; Chen, Jinping; Fu, Xing; Hu, Xiaotang

    2012-01-01

    A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system’s dynamic response, the frequency modulation (FM) mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system’s good measurement performance and feasibility of the hybrid measurement method. PMID:22368463

  6. Development of a hybrid atomic force microscopic measurement system combined with white light scanning interferometry.

    PubMed

    Guo, Tong; Wang, Siming; Dorantes-Gonzalez, Dante J; Chen, Jinping; Fu, Xing; Hu, Xiaotang

    2012-01-01

    A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system's dynamic response, the frequency modulation (FM) mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system's good measurement performance and feasibility of the hybrid measurement method. PMID:22368463

  7. Determination of elastic moduli of thin layers of soft material using the atomic force microscope.

    PubMed Central

    Dimitriadis, Emilios K; Horkay, Ferenc; Maresca, Julia; Kachar, Bechara; Chadwick, Richard S

    2002-01-01

    We address three problems that limit the use of the atomic force microscope when measuring elastic moduli of soft materials at microscopic scales. The first concerns the use of sharp cantilever tips, which typically induce local strains that far exceed the linear material regime. We show that this problem can be alleviated by using microspheres as probes, and we establish the criteria for their use. The second relates to the common use of the Hertz contact mechanics model, which leads to significant errors when applied to thin samples. We develop novel, simple to use corrections to apply for such cases. Samples that are either bonded or not bonded to a rigid substrate are considered. The third problem concerns the difficulty in establishing when contact occurs on a soft material. We obtain error estimates for the elastic modulus resulting from such uncertainty and discuss the sensitivity of the estimation methods to error in contact point. The theoretical and experimental results are compared to macroscopic measurements on poly(vinyl-alcohol) gels. PMID:11964265

  8. Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes.

    PubMed

    Iwatsuki; Suzuki; Kitamura; Kersker

    1999-05-01

    : With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 x 7 structures and Si(100) 2 x 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method. PMID:10383993

  9. Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes

    NASA Astrophysics Data System (ADS)

    Iwatsuki, Masashi; Suzuki, Kazuyuki; Kitamura, Shin-Ich; Kersker, Mike

    1999-05-01

    With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 × 7 structures and Si(100) 2 × 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.

  10. Atomic force microscope observations of otoconia in the newt

    NASA Technical Reports Server (NTRS)

    Hallworth, R.; Wiederhold, M. L.; Campbell, J. B.; Steyger, P. S.

    1995-01-01

    Calcitic and aragonitic otoconia from the Japanese red-bellied newt, Cynops pyrrhogaster, were examined using an atomic force microscope. The surface structure of both otoconial polymorphs consisted of arrays of elements approximately 50 nm in diameter. Elements were generally round and were separated by shallow depressions of no more than 20 nm. The elements are suggested to be single crystals of calcium carbonate. The relationship of these observations to theories of otoconial genesis is discussed.

  11. Glue-free tuning fork shear-force microscope

    NASA Astrophysics Data System (ADS)

    Mühlschlegel, P.; Toquant, J.; Pohl, D. W.; Hecht, B.

    2006-01-01

    A scanning near-field optical microscope without any glued parts is described. Key elements are the optical fiber probe/tuning fork junction and the piezotube scanner assembly. In both cases, fixation is achieved by means of controlled pressure and elastic deformation. The avoidance of glued connections was found to improve the Q factor of the shear-force sensor as well as to facilitate the replacement of the fiber probe and other parts of the scanner head. We present approach curves and shear-force images that demonstrate the performance and stability of the system.

  12. Probe-Sample Coupling in the Magnetic Resonance Force Microscope

    NASA Astrophysics Data System (ADS)

    Suter, A.; Pelekhov, D. V.; Roukes, M. L.; Hammel, P. C.

    2002-02-01

    The magnetic resonance force microscope (MRFM) provides a route to achieving scanned probe magnetic resonance imaging with extremely high spatial resolution. Achieving this capability will require understanding the force exerted on a microscopic magnetic probe by a spatially extended sample over which the probe is scanned. Here we present a detailed analysis of this interaction between probe and sample. We focus on understanding the situation where the micromagnet mounted on the mechanical resonator generates a very inhomogeneous magnetic field and is scanned over a sample with at least one spatial dimension much larger than that of the micromagnet. This situation differs quite significantly from the conditions under which most MRFM experiments have been carried out where the sample is mounted on the mechanical resonator and placed in a rather weak magnetic field gradient. In addition to the concept of a sensitive slice (the spatial region where the magnetic resonance condition is met) it is valuable to map the forces exerted on the probe by spins at various locations; this leads to the concept of the force slice (the region in which spins exert force on the resonator). Results of this analysis, obtained both analytically and numerically, will be qualitatively compared with an initial experimental finding from an EPR-MRFM experiment carried out on DPPH at 4 K.

  13. Probe--sample coupling in the magnetic resonance force microscope.

    PubMed

    Suter, A; Pelekhov, D V; Roukes, M L; Hammel, P C

    2002-02-01

    The magnetic resonance force microscope (MRFM) provides a route to achieving scanned probe magnetic resonance imaging with extremely high spatial resolution. Achieving this capability will require understanding the force exerted on a microscopic magnetic probe by a spatially extended sample over which the probe is scanned. Here we present a detailed analysis of this interaction between probe and sample. We focus on understanding the situation where the micromagnet mounted on the mechanical resonator generates a very inhomogeneous magnetic field and is scanned over a sample with at least one spatial dimension much larger than that of the micromagnet. This situation differs quite significantly from the conditions under which most MRFM experiments have been carried out where the sample is mounted on the mechanical resonator and placed in a rather weak magnetic field gradient. In addition to the concept of a sensitive slice (the spatial region where the magnetic resonance condition is met) it is valuable to map the forces exerted on the probe by spins at various locations; this leads to the concept of the force slice (the region in which spins exert force on the resonator). Results of this analysis, obtained both analytically and numerically, will be qualitatively compared with an initial experimental finding from an EPR-MRFM experiment carried out on DPPH at 4 K. PMID:11846579

  14. A Homotopy Perturbation-Based Method for Large Deflection of a Cantilever Beam Under a Terminal Follower Force

    NASA Astrophysics Data System (ADS)

    Wang, Yong-Gang; Lin, Wen-Hui; Liu, Ning

    2012-05-01

    The large deflection problem of a uniform cantilever beam subjected to a terminal concentrated follower force is investigated. The governing equations, which characterize a two-point boundary value problem, are transformed into an initial-value problem. A new algorithm based on the homotopy perturbation method is proposed and applied to the resulting problem and the characteristics of load versus displacement are obtained analytically. The convergence of this method is discussed and the details of load-deflection curves are present. Compared with other existing methods, the present scheme is shown to be highly accurate, while only lower order perturbation is required.

  15. The effective quality factor at low temperatures in dynamic force microscopes with Fabry-Pérot interferometer detection

    NASA Astrophysics Data System (ADS)

    Hölscher, Hendrik; Milde, Peter; Zerweck, Ulrich; Eng, Lukas M.; Hoffmann, Regina

    2009-06-01

    The oscillation of a cantilever in ultrahigh vacuum dynamic force microscopy is sometimes measured with the help of a Fabry-Pérot interferometer. We show that the photoinduced forces present in such an interferometer can artificially increase or decrease the effective quality factor of the cantilever. We examine this effect on the basis of a PtIr-coated rectangular silicon cantilever at temperatures between 7.7 and 30 K. By measuring resonance curves we demonstrate that the magnitude of the effective quality factor changes with cantilever-fiber distance, laser power, and temperature.

  16. Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

    PubMed Central

    Parkin, John D

    2016-01-01

    Summary Micro- and nanocantilevers are employed in atomic force microscopy (AFM) and in micro- and nanoelectromechanical systems (MEMS and NEMS) as sensing elements. They enable nanomechanical measurements, are essential for the characterization of nanomaterials, and form an integral part of many nanoscale devices. Despite the fact that numerous methods described in the literature can be applied to determine the static flexural spring constant of micro- and nanocantilever sensors, experimental techniques that do not require contact between the sensor and a surface at some point during the calibration process are still the exception rather than the rule. We describe a noncontact method using a microfluidic force tool that produces accurate forces and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8–160 N/m). PMID:27335740

  17. Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool.

    PubMed

    Parkin, John D; Hähner, Georg

    2016-01-01

    Micro- and nanocantilevers are employed in atomic force microscopy (AFM) and in micro- and nanoelectromechanical systems (MEMS and NEMS) as sensing elements. They enable nanomechanical measurements, are essential for the characterization of nanomaterials, and form an integral part of many nanoscale devices. Despite the fact that numerous methods described in the literature can be applied to determine the static flexural spring constant of micro- and nanocantilever sensors, experimental techniques that do not require contact between the sensor and a surface at some point during the calibration process are still the exception rather than the rule. We describe a noncontact method using a microfluidic force tool that produces accurate forces and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8-160 N/m). PMID:27335740

  18. Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

    SciTech Connect

    An, Sangmin; Lee, Kunyoung; Kim, Bongsu; Noh, Haneol; Kim, Jongwoo; Kwon, Soyoung; Lee, Manhee; Hong, Mun-Heon; Jhe, Wonho

    2014-03-15

    This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

  19. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

    PubMed Central

    Klocke, Michael

    2016-01-01

    Summary A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  20. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  1. Acoustic Imaging of Ferroelectric Domains in BaTiO3 Single Crystals Using Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Zeng, Huarong; Shimamura, Kiyoshi; Kannan, Chinna Venkadasamy; Villora, Encarnacion G.; Takekawa, Shunji; Kitamura, Kenji; Yin, Qingrui

    2007-01-01

    An “alternating-force-modulated” atomic force microscope (AFM) operating in the acoustic mode, generated by launching acoustic waves on the piezoelectric transducer that is attached to the cantilever, was used to visualize the ferroelectric domains in barium titanate (BaTiO3) single crystals by detecting acoustic vibrations generated by the tip and transmitted through the sample placed beneath it to the transducer. The acoustic signal was found to reflect locally elastic microstructures at low frequencies, while high-frequency acoustic images revealed strip like domain configurations of internal substructures in BaTiO3 single crystals. The underlying acoustic imaging mechanism using the AFM was discussed in terms of the interaction between the excited acoustic wave and ferroelectric domains.

  2. Bifurcation, chaos, and scan instability in dynamic atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Cantrell, John H.; Cantrell, Sean A.

    2016-03-01

    The dynamical motion at any point on the cantilever of an atomic force microscope can be expressed quite generally as a superposition of simple harmonic oscillators corresponding to the vibrational modes allowed by the cantilever shape. Central to the dynamical equations is the representation of the cantilever-sample interaction force as a polynomial expansion with coefficients that account for the interaction force "stiffness," the cantilever-to-sample energy transfer, and the displacement amplitude of cantilever oscillation. Renormalization of the cantilever beam model shows that for a given cantilever drive frequency cantilever dynamics can be accurately represented by a single nonlinear mass-spring model with frequency-dependent stiffness and damping coefficients [S. A. Cantrell and J. H. Cantrell, J. Appl. Phys. 110, 094314 (2011)]. Application of the Melnikov method to the renormalized dynamical equation is shown to predict a cascade of period doubling bifurcations with increasing cantilever drive force that terminates in chaos. The threshold value of the drive force necessary to initiate bifurcation is shown to depend strongly on the cantilever setpoint and drive frequency, effective damping coefficient, nonlinearity of the cantilever-sample interaction force, and the displacement amplitude of cantilever oscillation. The model predicts the experimentally observed interruptions of the bifurcation cascade for cantilevers of sufficiently large stiffness. Operational factors leading to the loss of image quality in dynamic atomic force microscopy are addressed, and guidelines for optimizing scan stability are proposed using a quantitative analysis based on system dynamical parameters and choice of feedback loop parameter.

  3. Diagonal control design for atomic force microscope piezoelectric tube nanopositioners.

    PubMed

    Bhikkaji, B; Yong, Y K; Mahmood, I A; Moheimani, S O R

    2013-02-01

    Atomic Force Microscopes (AFM) are used for generating surface topography of samples at micro to atomic resolutions. Many commercial AFMs use piezoelectric tube nanopositioners for scanning. Scanning rates of these microscopes are hampered by the presence of low frequency resonant modes. When inadvertently excited, these modes lead to high amplitude mechanical vibrations causing the loss of accuracy, while scanning, and eventually to break down of the tube. Feedback control has been used to damp these resonant modes. Thereby, enabling higher scanning rates. Here, a multivariable controller is designed to damp the first resonant mode along both the x and y axis. Exploiting the inherent symmetry in the piezoelectric tube, the multivariable control design problem is recast as independent single-input single-output (SISO) designs. This in conjunction with integral resonant control is used for damping the first resonant mode. PMID:23464216

  4. Waveguide ultrasonic force microscopy at 60 MHz

    NASA Astrophysics Data System (ADS)

    Inagaki, K.; Kolosov, O. V.; Briggs, G. A. D.; Wright, O. B.

    2000-04-01

    We present measurements using ultrasonic force microscopy at ˜60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.

  5. Quantitative metallography of structural materials with the atomic force microscope

    SciTech Connect

    Goeken, M.; Vehoff, H.

    1996-10-15

    The atomic force microscopy (AFM) is now a well-established technique for imaging surface topography with high resolution and can be used to study the microstructure of structural materials in a nanometer range. On multiphase materials a contrast in the topographic AFM images is obtained from small height differences between the different phases. Accordingly investigations of microstructures that are prepared to have small height differences between the phases can be done. The AFM needs no vacuum, large specimen areas compared to the small areas in thinned TEM foils can be analyzed. This reduces the costs of the measurements significantly. In addition it is advantageous that all measurements are stored as data files in the computer and therefore quantitative evaluations of the topographic data can be performed directly. The microstructures of different crystalline alloys were investigated with the atomic force microscope. The examples include superalloys (Waspaloy, CMSX-6), martensitic transformed surfaces (NiAlCo), and steels (microalloyed steel, perlitic carbon steel).

  6. Nanoindentation of gold nanorods with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Reischl, B.; Kuronen, A.; Nordlund, K.

    2014-12-01

    The atomic force microscope (AFM) can be used to measure mechanical properties of nanoscale objects, which are too small to be studied using a conventional nanoindenter. The contact mechanics at such small scales, in proximity of free surfaces, deviate substantially from simple continuum models. We present results from atomistic computer simulations of the indentation of gold nanorods using a diamond AFM tip and give insight in the atomic scale processes, involving creation and migration of dislocations, leading to the plastic deformation of the sample under load, and explain the force-distance curves observed for different tip apex radii of curvature, as well as different crystallographic structure and orientation of the gold nanorod samples.

  7. A high-pressure atomic force microscope for imaging in supercritical carbon dioxide

    SciTech Connect

    Lea, A. S.; Higgins, S. R.; Knauss, K. G.; Rosso, K. M.

    2011-01-01

    A high-pressure atomic force microscope(AFM) that enables in situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO2 (scCO2) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ~350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO2, precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluidrefractive index and hence the laser path. We demonstrate with our apparatus in situ atomic scale imaging of a calcite (CaCO3) mineral surface in scCO2; both single, monatomic steps and dynamic processes occurring on the (101¯4) surface are presented. Finally, this new AFM provides unprecedented in situ access to interfacial phenomena at solid–fluid interfaces under pressure.

  8. A high-pressure atomic force microscope for imaging in supercritical carbon dioxide

    SciTech Connect

    Lea, Alan S.; Higgins, Steven R.; Knauss, Kevin G.; Rosso, Kevin M.

    2011-04-26

    A high-pressure atomic force microscope (AFM) that enables in-situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO2 (scCO2) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ~ 350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO2, precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluid refractive index and hence the laser path. We demonstrate with our apparatus in-situ atomic scale imaging of a calcite (CaCO3) mineral surface in scCO2; both single, monatomic steps and dynamic processes occurring on the (10¯14) surface are presented. This new AFM provides unprecedented in-situ access to interfacial phenomena at solid-fluid interfaces under pressure.

  9. Characterization of the photocurrents generated by the laser of atomic force microscopes.

    PubMed

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Iglesias, Vanessa; Lewis, David; Niu, Jiebin; Long, Shibing; Liu, Ming; Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther; Scheuermann, Andrew; McIntyre, Paul C; Lanza, Mario

    2016-08-01

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem. PMID:27587127

  10. Characterization of the photocurrents generated by the laser of atomic force microscopes

    NASA Astrophysics Data System (ADS)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Iglesias, Vanessa; Lewis, David; Niu, Jiebin; Long, Shibing; Liu, Ming; Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther; Scheuermann, Andrew; McIntyre, Paul C.; Lanza, Mario

    2016-08-01

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

  11. Low-voltage and high-performance buzzer-scanner based streamlined atomic force microscope system

    NASA Astrophysics Data System (ADS)

    Wang, Wei-Min; Huang, Kuang-Yuh; Huang, Hsuan-Fu; Hwang, Ing-Shouh; Hwu, En-Te

    2013-11-01

    In this paper we present a novel scanner design in a quad-rod actuation structure, actuated by piezoelectric disk buzzers, and a new type of atomic force microscope (AFM), which uses this buzzer-scanner and a compact disk/digital-versatile-disk astigmatic optical pickup unit (OPU) for the detection of cantilever movements. Commercially available piezoelectric disk buzzers have a low capacitance and can be driven by low-voltage signal sources, such as analog outputs from a data acquisition card, without additional voltage or current amplifiers. Various scanning ranges can be realized through changing the dimensions of the actuation structure and/or the choice of disk buzzer. We constructed a buzzer-scanner and evaluated its performance. The scanner had a scanning range of 15 μm in the X and Y directions and an actuation range of 3.5 μm on the Z axis, with nonlinearity of 2.11%, 2.73%, and 2.19% for the X,Y and Z axes, respectively. The scanner had a resonance frequency of approximately 360 Hz on the X and Y axes, and 4.12 kHz on the Z axis. An OPU-AFM with this buzzer-scanner can resolve single atomic steps of a graphite substrate with a noise level of 0.06 nm. The obtained topographic images exhibit much less distortion than those obtained with an AFM using a piezoelectric tube scanner.

  12. Optical detection system for probing cantilever deflections parallel to a sample surface.

    PubMed

    Labuda, A; Brastaviceanu, T; Pavlov, I; Paul, W; Rassier, D E

    2011-01-01

    To date, commercial atomic force microscopes have been optimized for measurements of forces perpendicular to the sample surface. In many applications, sensitive parallel force measurements are desirable. These can be obtained by positioning the cantilever with its long axis perpendicular to the sample: the so-called pendulum geometry. We present a compact optical beam deflection system which solves the geometrical constraint problems involved in focusing a light beam onto a cantilever in the pendulum geometry. We demonstrate the performance of the system on measurements of forces imparted by a muscle myofibril, which is in-plane to a high-magnification objective of an optical microscope. PMID:21280831

  13. Stretching of Single Polymer Chains Using the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Ortiz, C.; van der Vegte, E. W.; van Swieten, E.; Robillard, G. T.; Hadziioannou, G.

    1998-03-01

    A variety of macroscopic phenomenon involve "nanoscale" polymer deformation including rubber elasticity, shear yielding, strain hardening, stress relaxation, fracture, and flow. With the advent of new and improved experimental techniques, such as the atomic force microscope (AFM), the probing of physical properties of polymers has reached finer and finer scales. The development of mixed self-assembling monolayer techniques and the chemical functionalization of AFM probe tips has allowed for mechanical experiments on single polymer chains of molecular dimensions. In our experiments, mixed monolayers are prepared in which end-functionalized, flexible polymer chains of thiol-terminated poly(methacrylic acid) are covalently bonded, isolated, and randomly distributed on gold substrates. The coils are then imaged, tethered to a gold-coated AFM tip, and stretched between the tip and the substrate in a conventional force / distance experiment. An increase in the attractive force due to entropic, elastic resistance to stretching, as well as fracture of the polymer chain is observed. The effect of chain stiffness, topological constraints, strain rate, mechanical hysteresis, and stress relaxation were investigated. Force modulation techniques were also employed in order to image the viscoelastic character of the polymer chains. Parallel work includes similar studies of biological systems such as wheat gluten proteins and polypeptides.

  14. Direct measurements of the extraordinary optical momentum and transverse spin-dependent force using a nano-cantilever

    NASA Astrophysics Data System (ADS)

    Antognozzi, M.; Bermingham, C. R.; Harniman, R. L.; Simpson, S.; Senior, J.; Hayward, R.; Hoerber, H.; Dennis, M. R.; Bekshaev, A. Y.; Bliokh, K. Y.; Nori, F.

    2016-08-01

    Radiation pressure is associated with the momentum of light, and it plays a crucial role in a variety of physical systems. It is usually assumed that both the optical momentum and the radiation-pressure force are naturally aligned with the propagation direction of light, given by its wavevector. Here we report the direct observation of an extraordinary optical momentum and force directed perpendicular to the wavevector, and proportional to the optical spin (degree of circular polarization). Such an optical force was recently predicted for evanescent waves and other structured fields. It can be associated with the ’spin-momentum’ part of the Poynting vector, introduced by Belinfante in field theory 75 years ago. We measure this unusual transverse momentum using a femtonewton-resolution nano-cantilever immersed in an evanescent optical field above the total internal reflecting glass surface. Furthermore, the measured transverse force exhibits another polarization-dependent contribution determined by the imaginary part of the complex Poynting vector. By revealing new types of optical forces in structured fields, our findings revisit fundamental momentum properties of light and enrich optomechanics.

  15. Nanoscale Subsurface Imaging via Resonant Difference-Frequency Atomic Force Ultrasonic Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, Sean A.; Cantrell, John H.; Lilehei, Peter T.

    2007-01-01

    A novel scanning probe microscope methodology has been developed that employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by the fundamental resonance frequency of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever fundamental resonance. The resonance-enhanced difference-frequency signals are used to create images of embedded nanoscale features.

  16. Interlaboratory comparison of traceable atomic force microscope pitch measurements

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald; Chernoff, Donald A.; Wang, Shihua; Vorburger, Theodore V.; Tan, Siew Leng; Orji, Ndubuisi G.; Fu, Joseph

    2010-06-01

    The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have completed a three-way interlaboratory comparison of traceable pitch measurements using atomic force microscopy (AFM). The specimen being used for this comparison is provided by ASM and consists of SiO2 lines having a 70 nm pitch patterned on a silicon substrate. NIST has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NIST C-AFM has displacement metrology for all three axes traceable to the 633 nm wavelength of the iodine-stabilized He-Ne laser - a recommended wavelength for realization of the SI (Système International d'Unités, or International System of Units) meter. NIST used the C-AFM to participate in this comparison. ASM used a commercially available AFM with an open-loop scanner, calibrated by a 144 nm pitch transfer standard. In a prior collaboration with Physikalisch-Technische Bundesanstalt (PTB), the German national metrology institute, ASM's transfer standard was calibrated using PTB's traceable optical diffractometry instrument. Thus, ASM's measurements are also traceable to the SI meter. NMC/A*STAR used a large scanning range metrological atomic force microscope (LRM-AFM). The LRM-AFM integrates an AFM scanning head into a nano-stage equipped with three built-in He-Ne laser interferometers so that its measurement related to the motion on all three axes is directly traceable to the SI meter. The measurements for this interlaboratory comparison have been completed and the results are in agreement within their expanded uncertainties and at the level of a few parts in 104.

  17. Diversity between shell-like and beam-like regions for a cantilever cylindrical shell under follower forces

    NASA Astrophysics Data System (ADS)

    Torki, Mohammad Ebrahim; Kazemi, Mohammad Taghi; Mahmoudkhani, Saied

    2012-12-01

    The effect of length and thickness on dynamic stability analysis of cantilever cylindrical shells under follower forces is addressed. Beck's, Leipholz's, and Hauger's problems were solved for cylindrical shells with different length-to-radius and thicknesses-to-radius ratios using the Galerkin method. First-order shear theory was used, and rotary inertias were considered in deriving the differential equations. Critical circumferential and longitudinal mode numbers and loads were evaluated for each case. Diagrams containing nondimensional load parameters vs. length and thickness parameters were plotted for each problem. For some shells with small length-to-radius ratios, flutter occurred in high longitudinal mode numbers where the first-order shear theory may not suffice to accurately evaluate the deformations. However, for long and moderately thick shells, there are ranges in which the shell can be analyzed using the simplified equivalent beam model.

  18. Current, charge, and capacitance during scanning probe oxidation of silicon. II. Electrostatic and meniscus forces acting on cantilever bending

    NASA Astrophysics Data System (ADS)

    Dagata, J. A.; Perez-Murano, F.; Martin, C.; Kuramochi, H.; Yokoyama, H.

    2004-08-01

    A comprehensive analysis of the electrical current passing through the tip-substrate junction during oxidation of silicon by scanning probe microscopy (SPM) is presented. This analysis identifies the electronic and ionic contributions to the total current, especially at the initial stages of the reaction, determines the effective contact area of the tip-substrate junction, and unifies the roles of space charge and meniscus formation. In this work, we concentrate on noncontact SPM oxidation. We analyze simultaneous force-distance and current-distance curves to demonstrate that total current flow during noncontact oxidation is significantly less for noncontact mode than for contact oxidation, although the resulting oxide volume is nearly identical. Ionization of water layers and mobile charge reorganization prior to and following meniscus formation is also shown to alter the tip-substrate capacitance and, therefore, the bending of the SPM cantilever.

  19. A new ion sensing deep atomic force microscope

    NASA Astrophysics Data System (ADS)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-01

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  20. A new ion sensing deep atomic force microscope

    SciTech Connect

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  1. A new ion sensing deep atomic force microscope

    PubMed Central

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-01-01

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves. PMID:25173275

  2. A Novel Atomic Force Microscope with Multi-Mode Scanner

    NASA Astrophysics Data System (ADS)

    Qin, Chun; Zhang, Haijun; Xu, Rui; Han, Xu; Wang, Shuying

    2016-01-01

    A new type of atomic force microscope (AFM) with multi-mode scanner is proposed. The AFM system provides more than four scanning modes using a specially designed scanner with three tube piezoelectric ceramics and three stack piezoelectric ceramics. Sample scanning of small range with high resolution can be realized by using tube piezos, meanwhile, large range scanning can be achieved by stack piezos. Furthermore, the combination with tube piezos and stack piezos not only realizes high-resolution scanning of small samples with large- scale fluctuation structure, but also achieves small range area-selecting scanning. Corresponding experiments are carried out in terms of four different scanning modes showing that the AFM is of reliable stability, high resolution and can be widely applied in the fields of micro/nano-technology.

  3. The long range voice coil atomic force microscope

    SciTech Connect

    Barnard, H.; Randall, C.; Bridges, D.; Hansma, P. K.

    2012-02-15

    Most current atomic force microscopes (AFMs) use piezoelectric ceramics for scan actuation. Piezoelectric ceramics provide precision motion with fast response to applied voltage potential. A drawback to piezoelectric ceramics is their inherently limited ranges. For many samples this is a nonissue, as imaging the nanoscale details is the goal. However, a key advantage of AFM over other microscopy techniques is its ability to image biological samples in aqueous buffer. Many biological specimens have topography for which the range of piezoactuated stages is limiting, a notable example of which is bone. In this article, we present the use of voice coils in scan actuation for an actuation range in the Z-axis an order of magnitude larger than any AFM commercially available today. The increased scan size will allow for imaging an important new variety of samples, including bone fractures.

  4. Friction force measurements relevant to de-inking by means of atomic force microscope.

    PubMed

    Theander, Katarina; Pugh, Robert J; Rutland, Mark W

    2005-11-15

    In the pulping step of the de-inking process, the ink detaches from the fibers due to shear and physical chemical interaction. In order to get a better understanding of the forces involved between cellulose and ink, the atomic force microscope and the colloidal probe technique have been used in the presence of a model chemical dispersant (hexa-ethyleneglycol mono n-dodecyl ether, C12E6). A cellulose bead was used as the colloidal probe and three different lower surfaces have been used, an alkyd resin, mica and a cellulose sphere. The normal and lateral forces have been measured at a range of nonionic concentrations. It was found that the lateral sliding friction forces deceased with increasing surfactant concentration for both the alkyd resin and mica while no differences were observed for the cellulose surface. In addition, only a very small change in normal force could be detected for the alkyd surface as the concentration changed. PMID:15961095

  5. Recurrence tracking microscope

    SciTech Connect

    Saif, Farhan

    2006-03-15

    In order to probe nanostructures on a surface we present a microscope based on the quantum recurrence phenomena. A cloud of atoms bounces off an atomic mirror connected to a cantilever and exhibits quantum recurrences. The times at which the recurrences occur depend on the initial height of the bouncing atoms above the atomic mirror, and vary following the structures on the surface under investigation. The microscope has inherent advantages over existing techniques of scanning tunneling microscope and atomic force microscope. Presently available experimental technology makes it possible to develop the device in the laboratory.

  6. Microscopic ESR study of N@C60 using a Magnetic Resonance Force Microscope

    NASA Astrophysics Data System (ADS)

    Banerjee, P.; Pelekhov, D. V.; Fong, K. C.; Lee, I. H.; Hammel, P. C.; Harneit, W.

    2007-03-01

    We report electron spin resonance studies of the endohedral fullerene N@C60 using the novel technique of magnetic resonance force microscopy (MRFM). These studies are performed at temperatures down to 1 K on both thin films of N@C60 and in samples where the endohedral fullerene is incorporated into a bulk crystalline matrix. Utilizing the large magnetic field gradients (˜ 10^5 Tesla/meter) in the vicinity of our micromagnetic probe tip, we are able to selectively probe the electron spins in sub--micron volumes. Further, our schemes for spin manipulation allow us to measure the spin--lattice relaxation rate (T1-1) with a spatial resolution in one dimension of approximately 20 nanometers. We will also discuss our efforts to improve the sensitivity of our microscope for detecting individual electronic spins. B. Naydenov, C. Spudat, W. Harneit, H. I. Suss, J. Hullinger, J. Nuss, M. Jansen, Chem. Phys. Lett., 424, 327 (2006).

  7. Low-voltage and high-performance buzzer-scanner based streamlined atomic force microscope system.

    PubMed

    Wang, Wei-Min; Huang, Kuang-Yuh; Huang, Hsuan-Fu; Hwang, Ing-Shouh; Hwu, En-Te

    2013-11-15

    In this paper we present a novel scanner design in a quad-rod actuation structure, actuated by piezoelectric disk buzzers, and a new type of atomic force microscope (AFM), which uses this buzzer-scanner and a compact disk/digital-versatile-disk astigmatic optical pickup unit (OPU) for the detection of cantilever movements. Commercially available piezoelectric disk buzzers have a low capacitance and can be driven by low-voltage signal sources, such as analog outputs from a data acquisition card, without additional voltage or current amplifiers. Various scanning ranges can be realized through changing the dimensions of the actuation structure and/or the choice of disk buzzer. We constructed a buzzer-scanner and evaluated its performance. The scanner had a scanning range of 15 μm in the X and Y directions and an actuation range of 3.5 μm on the Z axis, with nonlinearity of 2.11%, 2.73%, and 2.19% for the X,Y and Z axes, respectively. The scanner had a resonance frequency of approximately 360 Hz on the X and Y axes, and 4.12 kHz on the Z axis. An OPU-AFM with this buzzer-scanner can resolve single atomic steps of a graphite substrate with a noise level of 0.06 nm. The obtained topographic images exhibit much less distortion than those obtained with an AFM using a piezoelectric tube scanner. PMID:24141269

  8. Effect of centrifugal force on critical flutter speed on a uniform cantilever beam

    NASA Technical Reports Server (NTRS)

    Mendelson, Alexander

    1948-01-01

    Semirigid flutter theory is used. Calculations are made on airfoils with fundamental bending frequencies up to 2000 radian per second. Centrifugal force can under certain conditions reduce the critical flutter speed.

  9. Large dynamic range Atomic Force Microscope for overlay improvements

    NASA Astrophysics Data System (ADS)

    Kuiper, Stefan; Fritz, Erik; Crowcombe, Will; Liebig, Thomas; Kramer, Geerten; Witvoet, Gert; Duivenvoorde, Tom; Overtoom, Ton; Rijnbeek, Ramon; van Zwet, Erwin; van Dijsseldonk, Anton; den Boef, Arie; Beems, Marcel; Levasier, Leon

    2016-03-01

    Nowadays most overlay metrology tools assess the overlay performance based on marker features which are deposited next to the functional device features within each layer of the semiconductor device. However, correct overlay of the relatively coarse marker features does not directly guarantee correct overlay of the much smaller device features. This paper presents the development of a tool that allows to measure the relative distance between the marker and device features within each layer of the semiconductor device, which can be used to improve the overlay at device feature level. In order to be effective, the marker to device feature distance should be measured with sub-nanometer measurement uncertainty over several millimeters range. Furthermore, the tool should be capable of profiling the marker features to allows prediction of the location interpretation of the optical diffraction based alignment sensors, which are sensitive for potential asymmetry of the marker features. To enable this, a highly stable Atomic Force Microscope system is being developed. The probe is positioned relative to the wafer with a 6DOF controlled hexapod stage, which has a relatively large positioning range of 8x8mm. The position and orientation of this stage is measured relative to the wafer using 6 interferometers via a highly stable metrology frame. A tilted probe concept is utilized to allow profiling of the high aspect ratio marker and device features. Current activities are aimed at demonstrating the measurement capabilities of the developed AFM system.

  10. Laser interferometry force-feedback sensor for an interfacial force microscope

    DOEpatents

    Houston, Jack E.; Smith, William L.

    2004-04-13

    A scanning force microscope is provided with a force-feedback sensor to increase sensitivity and stability in determining interfacial forces between a probe and a sample. The sensor utilizes an interferometry technique that uses a collimated light beam directed onto a deflecting member, comprising a common plate suspended above capacitor electrodes situated on a substrate forming an interference cavity with a probe on the side of the common plate opposite the side suspended above capacitor electrodes. The probe interacts with the surface of the sample and the intensity of the reflected beam is measured and used to determine the change in displacement of the probe to the sample and to control the probe distance relative to the surface of the sample.

  11. Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

    NASA Astrophysics Data System (ADS)

    Tseng, Ampere A.; Kuo, Chung-Feng Jeffrey; Jou, Shyankay; Nishimura, Shinya; Shirakashi, Jun-ichi

    2011-09-01

    The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

  12. Accurate flexural spring constant calibration of colloid probe cantilevers using scanning laser Doppler vibrometry

    NASA Astrophysics Data System (ADS)

    Gates, Richard S.; Osborn, William A.; Shaw, Gordon A.

    2015-06-01

    Calibration of the flexural spring constant for atomic force microscope (AFM) colloid probe cantilevers provides significant challenges. The presence of a large attached spherical added mass complicates many of the more common calibration techniques such as reference cantilever, Sader, and added mass. Even the most promising option, AFM thermal calibration, can encounter difficulties during the optical lever sensitivity measurement due to strong adhesion and friction between the sphere and a surface. This may cause buckling of the end of the cantilever and hysteresis in the approach-retract curves resulting in increased uncertainty in the calibration. Most recently, a laser Doppler vibrometry thermal method has been used to accurately calibrate the normal spring constant of a wide variety of tipped and tipless commercial cantilevers. This paper describes a variant of the technique, scanning laser Doppler vibrometry, optimized for colloid probe cantilevers and capable of spring constant calibration uncertainties near ±1%.

  13. Controlling the opto-mechanics of a cantilever in an interferometer via cavity loss

    SciTech Connect

    Schmidsfeld, A. von Reichling, M.

    2015-09-21

    In a non-contact atomic force microscope, based on interferometric cantilever displacement detection, the optical return loss of the system is tunable via the distance between the fiber end and the cantilever. We utilize this for tuning the interferometer from a predominant Michelson to a predominant Fabry-Pérot characteristics and introduce the Fabry-Pérot enhancement factor as a quantitative measure for multibeam interference in the cavity. This experimentally easily accessible and adjustable parameter provides a control of the opto-mechanical interaction between the cavity light field and the cantilever. The quantitative assessment of the light pressure acting on the cantilever oscillating in the cavity via the frequency shift allows an in-situ measurement of the cantilever stiffness with remarkable precision.

  14. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers.

    PubMed

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian; Paris, Oskar

    2016-01-01

    We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  15. Effect of tip mass on frequency response and sensitivity of AFM cantilever in liquid.

    PubMed

    Farokh Payam, Amir; Fathipour, Morteza

    2015-03-01

    The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) cantilever in the liquid environment is investigated. For this purpose, using Euler-Bernoulli beam theory and considering tip mass and hydrodynamic functions in a liquid environment, an expression for the resonance frequencies of AFM cantilever in liquid is derived. Then, based on this expression, the effect of the surface contact stiffness on the flexural mode of a rectangular AFM cantilever in fluid is investigated and compared with the case where the AFM cantilever operates in the air. The results show that in contrast with an air environment, the tip mass has no significant impact on the resonance frequency and sensitivity of the AFM cantilever in the liquid. Hence, analysis of AFM behaviour in liquid environment by neglecting the tip mass is logical. PMID:25562584

  16. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

    PubMed Central

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian

    2016-01-01

    Summary We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  17. Contact resonances of U-shaped atomic force microscope probes

    NASA Astrophysics Data System (ADS)

    Rezaei, E.; Turner, J. A.

    2016-01-01

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  18. Free vibrations of U-shaped atomic force microscope probes

    NASA Astrophysics Data System (ADS)

    Rezaei, E.; Turner, J. A.

    2014-05-01

    Contact resonance atomic force microscope (AFM) methods have been used to quantify the elastic and viscoelastic properties of a variety of materials such as polymers, ceramics, biological materials, and metals with spatial resolution on the order of tens of nanometers. This approach involves measurement of the resonant frequencies of the AFM probe both for the free case and the case for which the tip is in contact with a sample. Vibration models of the probe and tip-sample contact models are then used to determine the sample properties from the frequency behavior and to create images of the sample properties. This work has been primarily focused on rectangular, single-beam probes for which the vibration models are relatively simple. Recently, U-shaped AFM probes have been developed to allow local heating of samples and the resonances of these probes are much more complex. In this article, a simplified analytical model of these U-shaped probes is described. This three beam model includes two beams clamped at one end and connected with a perpendicular cross beam at the other end. The beams are assumed only to bend in flexure and twist but their coupling allows a wide range of possible dynamic behavior. Results are presented for the first ten modes and the mode shapes are shown to have complex coupling between the flexure and twisting of the beams, particularly for the higher modes. All resonant frequency results are in good agreement with finite element results for the three probe designs and two values of thickness considered (all wavenumbers are within 3.0%). This work is anticipated to allow U-shaped probes to be used eventually for quantitative measurements of sample material properties during heating using a contact resonance approach.

  19. Dynamic stability of functionally graded cantilever cylindrical shells under distributed axial follower forces

    NASA Astrophysics Data System (ADS)

    Torki, Mohammad Ebrahim; Kazemi, Mohammad Taghi; Reddy, Junuthula N.; Haddadpoud, Hassan; Mahmoudkhani, Saeid

    2014-02-01

    In this paper, flutter of functionally graded material (FGM) cylindrical shells under distributed axial follower forces is addressed. The first-order shear deformation theory is used to model the shell, and the material properties are assumed to be graded in the thickness direction according to a power law distribution using the properties of two base material phases. The solution is obtained by using the extended Galerkin's method, which accounts for the natural boundary conditions that are not satisfied by the assumed displacement functions. The effect of changing the concentrated (Beck's) follower force into the uniform (Leipholz's) and linear (Hauger's) distributed follower loads on the critical circumferential mode number and the minimum flutter load is investigated. As expected, the flutter load increases as the follower force changes from the so-called Beck's load into the so-called Leipholz's and Hauger's loadings. The increased flutter load was calculated for homogeneous shell with different mechanical properties, and it was found that the difference in elasticity moduli bears the most significant effect on the flutter load increase in short, thick shells. Also, for an FGM shell, the increase in the flutter load was calculated directly, and it was found that it can be derived from the simple power law when the corresponding increase for the two base phases are known.

  20. Accurate Calibration and Uncertainty Estimation of the Normal Spring Constant of Various AFM Cantilevers

    PubMed Central

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-01-01

    Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical properties of materials in the biophysics and nanomechanical fields. The atomic force microscope (AFM) is widely used in microforce measurement. The cantilever probe works as an AFM force sensor, and the spring constant of the cantilever is of great significance to the accuracy of the measurement results. This paper presents a normal spring constant calibration method with the combined use of an electromagnetic balance and a homemade AFM head. When the cantilever presses the balance, its deflection is detected through an optical lever integrated in the AFM head. Meanwhile, the corresponding bending force is recorded by the balance. Then the spring constant can be simply calculated using Hooke’s law. During the calibration, a feedback loop is applied to control the deflection of the cantilever. Errors that may affect the stability of the cantilever could be compensated rapidly. Five types of commercial cantilevers with different shapes, stiffness, and operating modes were chosen to evaluate the performance of our system. Based on the uncertainty analysis, the expanded relative standard uncertainties of the normal spring constant of most measured cantilevers are believed to be better than 2%. PMID:25763650

  1. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    NASA Astrophysics Data System (ADS)

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-01

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  2. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    SciTech Connect

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-07

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  3. SI-traceable determination of the spring constant of a soft cantilever using the nanonewton force facility based on electrostatic methods

    NASA Astrophysics Data System (ADS)

    Nesterov, V.; Belai, O.; Nies, D.; Buetefisch, S.; Mueller, M.; Ahbe, T.; Naparty, D.; Popadic, R.; Wolff, H.

    2016-08-01

    The PTB’s (Physikalisch-Technische Bundesanstalt, Germany) nanonewton force facility, first presented in work by Nesterov (2007 Meas. Sci. Technol. 18 360–6), Nesterov (2009 Meas. Sci. Technol. 20 084012) and Nesterov et al (2009 Metrologia 46 277–82), has been significantly improved and used to measure the stiffness of a cantilever. The facility is based on a disc pendulum with electrostatic reduction of its deflection and stiffness. In this paper, we will demonstrate that the facility is able to measure horizontal forces in the range below 1 μN with a resolution below 5 pN and an uncertainty below 2.7% for a measured force of 1 nN at a measurement duration of about 20 s. We will demonstrate the possibility of using this facility as a calibration device that can accurately determine spring constants of soft cantilevers (K ≲ 0.1 N m‑1) with traceability to the SI units. The method and the results of measuring the spring constant of a soft cantilever (K  =  0.125 N m‑1) in air, in a medium vacuum, in a high vacuum and in nitrogen are presented. We will show that a relative standard uncertainty of the spring constant calibration of better than 0.3% (measurement in a medium vacuum) and a repeatability of better than 0.04% are achieved.

  4. Development of a nano manipulator based on an atomic force microscope coupled with a haptic device: a novel manipulation tool for scanning electron microscopy.

    PubMed

    Iwata, Futoshi; Kawanishi, Shinsuke; Aoyama, Hisayuki; Ushiki, Tatsuo

    2009-01-01

    We developed a novel nano manipulator based on an atomic force microscope (AFM) that can be operated inside the sample chamber of a scanning electron microscope (SEM). This AFM manipulator is also coupled with a haptic device, and the nanometer-scale movement of the AFM cantilever can be scaled up to the millimeter-scale movement of the pen handle of the haptic device. Using this AFM manipulation system, we were able to observe the AFM cantilever and samples under the SEM and obtain topographical images of the AFM under the SEM. These AFM images contained quantitative height information of the sample that is difficult to obtain from SEM images. Our system was also useful for positioning the cantilever for accurate AFM manipulation because the manipulation scene could be directly observed in real time by SEM. Coupling of the AFM manipulator with the haptic device was also useful for manipulation in the SEM since the operator can move the AFM probe freely at any position on the sample surface while feeling the interaction force between the probe and the sample surface. We tested two types of cutting methods: simple cutting and vibration cutting. Our results showed that vibration cutting with probe oscillation is very useful for the dissection of biological samples which were dried for SEM observation. Thus, cultivated HeLa cells were successfully micro-dissected by vibration cutting, and the dissection process could be observed in real time in the SEM. This AFM manipulation system is expected to serve as a powerful tool for dissecting various biological samples at the micro and nanometer-scale under SEM observation. PMID:21471662

  5. Closed-form approximation and numerical validation of the influence of van der Waals force on electrostatic cantilevers at nano-scale separations

    NASA Astrophysics Data System (ADS)

    Ramezani, Asghar; Alasty, Aria; Akbari, Javad

    2008-01-01

    In this paper the two-point boundary value problem (BVP) of the cantilever deflection at nano-scale separations subjected to van der Waals and electrostatic forces is investigated using analytical and numerical methods to obtain the instability point of the beam. In the analytical treatment of the BVP, the nonlinear differential equation of the model is transformed into the integral form by using the Green's function of the cantilever beam. Then, closed-form solutions are obtained by assuming an appropriate shape function for the beam deflection to evaluate the integrals. In the numerical method, the BVP is solved with the MATLAB BVP solver, which implements a collocation method for obtaining the solution of the BVP. The large deformation theory is applied in numerical simulations to study the effect of the finite kinematics on the pull-in parameters of cantilevers. The centerline of the beam under the effect of electrostatic and van der Waals forces at small deflections and at the point of instability is obtained numerically. In computing the centerline of the beam, the axial displacement due to the transverse deformation of the beam is taken into account, using the inextensibility condition. The pull-in parameters of the beam are computed analytically and numerically under the effects of electrostatic and/or van der Waals forces. The detachment length and the minimum initial gap of freestanding cantilevers, which are the basic design parameters, are determined. The results of the analytical study are compared with the numerical solutions of the BVP. The proposed methods are validated by the results published in the literature.

  6. Closed-form approximation and numerical validation of the influence of van der Waals force on electrostatic cantilevers at nano-scale separations.

    PubMed

    Ramezani, Asghar; Alasty, Aria; Akbari, Javad

    2008-01-01

    In this paper the two-point boundary value problem (BVP) of the cantilever deflection at nano-scale separations subjected to van der Waals and electrostatic forces is investigated using analytical and numerical methods to obtain the instability point of the beam. In the analytical treatment of the BVP, the nonlinear differential equation of the model is transformed into the integral form by using the Green's function of the cantilever beam. Then, closed-form solutions are obtained by assuming an appropriate shape function for the beam deflection to evaluate the integrals. In the numerical method, the BVP is solved with the MATLAB BVP solver, which implements a collocation method for obtaining the solution of the BVP. The large deformation theory is applied in numerical simulations to study the effect of the finite kinematics on the pull-in parameters of cantilevers. The centerline of the beam under the effect of electrostatic and van der Waals forces at small deflections and at the point of instability is obtained numerically. In computing the centerline of the beam, the axial displacement due to the transverse deformation of the beam is taken into account, using the inextensibility condition. The pull-in parameters of the beam are computed analytically and numerically under the effects of electrostatic and/or van der Waals forces. The detachment length and the minimum initial gap of freestanding cantilevers, which are the basic design parameters, are determined. The results of the analytical study are compared with the numerical solutions of the BVP. The proposed methods are validated by the results published in the literature. PMID:21730532

  7. Imaging of a soft, weakly adsorbing, living cell with a colloid probe tapping atomic force microscope technique.

    PubMed

    McNamee, Cathy E; Pyo, Nayoung; Tanaka, Saaya; Kanda, Yoichi; Higashitani, Ko

    2006-01-15

    Here, we propose a new method to improve the atomic force microscopy (AFM) image resolution of soft samples, such as cells, in liquid. Attaching a colloid probe to a cantilever was seen improve the image resolution of a living cell in a physiological buffer solution, obtained by the normal tapping mode, when compared to an image obtained using a regular cantilever tip. This may be due to the averaging out of the cantilever tip swinging caused by the visco-elasticity of the cell. The resolution was best, when silica spheres with a 3.3 microm diameter were attached. Although larger spheres gave a resolution better than a bare cantilever tip, their resolution was less than that obtained for the 3.3 microm diameter silica colloid. This dependency of the image resolution on the colloid probe size may be a result of the increased macroscopic van der Waals attraction between the cell and probe, the decreased repulsive force dependence on the cantilever probe radius, and the decrease in resolution due to the increased probe size. The size of the colloid probe, which should be attached to the cantilever to give the best image resolution, would be the one that optimises the combined result of these facts. PMID:16406494

  8. Micro-/nanosized cantilever beams and mass sensors under applied axial tensile/compressive force vibrating in vacuum and viscous fluid

    NASA Astrophysics Data System (ADS)

    Stachiv, Ivo; Fang, Te-Hua; Chen, Tao-Hsing

    2015-11-01

    Vibrating micro-/nanosized cantilever beams under an applied axial force are the key components of various devices used in nanotechnology. In this study, we perform a complete theoretical investigation of the cantilever beams under an arbitrary value of the axial force vibrating in a specific environment such as vacuum, air or viscous fluid. Based on the results easy accessible expressions enabling one the fast and highly accurate estimations of changes in the Q-factor and resonant frequencies of beam oscillating in viscous fluid caused by the applied axial force are derived and analyzed. It has been also shown that for beam-to-string and string vibrational regimes the mode shape starts to significantly deviate from the one known for a beam without axial force. Moreover, a linear dependency of the vibrational amplitude in resonance on the dimensionless tension parameter has been found. We revealed that only a large axial force, i.e. the string vibrational regime, significantly improves the Q-factor of beams submerged in fluid, while an increase of the axial force in beam and beam-to-string transition regimes has a negligibly small impact on the Q-factor enhancement. Experiments carried out on the carbon nanotubes and nanowires are in a good agreement with present theoretical predictions.

  9. Micro-/nanosized cantilever beams and mass sensors under applied axial tensile/compressive force vibrating in vacuum and viscous fluid

    SciTech Connect

    Stachiv, Ivo; Fang, Te-Hua; Chen, Tao-Hsing

    2015-11-15

    Vibrating micro-/nanosized cantilever beams under an applied axial force are the key components of various devices used in nanotechnology. In this study, we perform a complete theoretical investigation of the cantilever beams under an arbitrary value of the axial force vibrating in a specific environment such as vacuum, air or viscous fluid. Based on the results easy accessible expressions enabling one the fast and highly accurate estimations of changes in the Q-factor and resonant frequencies of beam oscillating in viscous fluid caused by the applied axial force are derived and analyzed. It has been also shown that for beam-to-string and string vibrational regimes the mode shape starts to significantly deviate from the one known for a beam without axial force. Moreover, a linear dependency of the vibrational amplitude in resonance on the dimensionless tension parameter has been found. We revealed that only a large axial force, i.e. the string vibrational regime, significantly improves the Q-factor of beams submerged in fluid, while an increase of the axial force in beam and beam-to-string transition regimes has a negligibly small impact on the Q-factor enhancement. Experiments carried out on the carbon nanotubes and nanowires are in a good agreement with present theoretical predictions.

  10. Novel thin membrane probe and a new twisting modulation force detection method of an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Nakano, Katsushi; Suzuki, Yoshihiko

    1999-04-01

    For inspection of high aspect ratio structures like narrow semiconductor trenches, a thin membrane probe and a new force detection method have been proposed. Instead of conventional conical and pyramidal tips, a thin silicon nitride cantilever was set up vertically, and its edge was used as a tip. The membrane probe named as twist-probe (TP) was oscillated in the twisting resonance to detect a force from both vertical and lateral directions. About 100 μm long, 0.7 μm thick TP was fabricated as a trial. Amplitude versus distance curve measurements showed that the TP has a high spacing change sensitivity between the tip and a sample in both vertical and lateral directions. A trench cross-section imaging was demonstrated successfully with a TP and the twist resonant force detection method.

  11. An Integrated Compact Unit for Wide Range Micro-Newton Force Measurement

    NASA Astrophysics Data System (ADS)

    Akanda, M. A. Salam; Tohmyoh, Hironori; Saka, Masumi

    Wide range compact sensor is preferably sought for force sensing in testing of micro objects or local area of macro objects with the observation of high resolution microscope. This paper presents the design and development of an integrated passive cantilever type force sensing unit with the specificities of range variation, interchangeability of components and compact size by incorporating with cantilever, probe and a capacitive sensor for measurement of large range micro-newton forces in wide scope of application. In the design, the tactile force at the probe perpendicularly attached to the cantilever is converted as cantilever deflection, which is measured by the capacitive sensor. In connection to a tiny capacitive sensor a compatible cantilever with double-beam structure is considered. Cantilever length variation facility is incorporated in the unit for obtaining different force measurement ranges by using the same cantilever. Characterization of the cantilever is performed against a standard load cell. The force resolution with a typical cantilever is estimated as 10 nN. The elastic property of human hair is efficiently determined by testing with the combination of a digital microscope and the developed sensor system. The utility of the unit for different resolution/range by the interchangeability of cantilevers is also demonstrated. Experimental results show that this integrated force sensing unit achieves good sensitivity and linearity, and wide measurement range.

  12. An approach towards 3D sensitive AFM cantilevers

    NASA Astrophysics Data System (ADS)

    Koops, Richard; Fokkema, Vincent

    2014-04-01

    The atomic force microscope (AFM) tapping mode is a highly sensitive local probing technique that is very useful to study and measure surface properties down to the atomic scale. The tapping mode is mostly implemented using the resonance of the first bending mode of the cantilever and therefore provides sensitivity mainly along the direction of this oscillation. Driven by the semiconductor industry, there is an increasing need for accurate measurements of nanoscale structures for side wall characterization by AFM that requires additional sensitivity in the lateral direction. The conventional tapping mode has been augmented by various authors, for example by tilting the cantilever system (Cho et al 2011 Rev. Sci. Instrum. 82 023707) to access the sidewall or using a torsion mode (Dai et al 2011 Meas. Sci. Technol. 22 094009) of the cantilever to provide additional lateral sensitivity. These approaches however trade lateral sensitivity for vertical sensitivity or still lack sensitivity in the remaining lateral direction. We present an approach towards true 3D sensitivity for AFM cantilevers based on simultaneous excitation and optical detection of multiple cantilever resonance modes along three axes. Tuning the excitation of the cantilever to specific frequencies provides a mechanism to select only those cantilever modes that have the desired characteristics. Additionally, cantilever engineering has been used to design and create a substructure within the cantilever that has been optimized for specific resonance behavior around 4 MHz. In contrast to the conventional approach of using a piezo to actuate the cantilever modulation, we present results on photo-thermal excitation using an intensity modulated low-power laser source. By tightly focusing the excitation spot on the cantilever we were able to attain a deflection efficiency of 0.7 nm µW-1 for the first bending mode. The presented approach results in an efficient all optical excitation and deflection detection

  13. Investigation of static and dynamic behavior of functionally graded piezoelectric actuated Poly-Si micro cantilever probe

    NASA Astrophysics Data System (ADS)

    Pandey, Vibhuti Bhushan; Parashar, Sandeep Kumar

    2016-04-01

    In the present paper a novel functionally graded piezoelectric (FGP) actuated Poly-Si micro cantilever probe is proposed for atomic force microscope. The shear piezoelectric coefficient d15 has much higher value than coupling coefficients d31 and d33, hence in the present work the micro cantilever beam actuated by d15 effect is utilized. The material properties are graded in the thickness direction of actuator by a simple power law. A three dimensional finite element analysis has been performed using COMSOL Multiphysics® (version 4.2) software. Tip deflection and free vibration analysis for the micro cantilever probe has been done. The results presented in the paper shall be useful in the design of micro cantilever probe and their subsequent utilization in atomic force microscopes.

  14. A Nuclear Magnetic Resonance Force Microscope for Micron-scale Liquids

    NASA Astrophysics Data System (ADS)

    Giraldo, Felipe; Paster, Jeremy W.; Tennant, Daniel M.; Markert, John T.

    2015-03-01

    We have designed and constructed a Nuclear Magnetic Resonance Force Microscopy (NMRFM) probe for the analysis of liquid and soft matter samples. This NRMFM probe uses a magnet-on-cantilever geometry and is equipped with dual x- y- z piezoelectric motion stages, for micron-step coarse positioning and sub-nanometer fine positioning of both the laser interferometer and the sample with respect to the cantilever, permitting three-dimensional scanning-mode detection of nuclear magnetism. The probe keeps the cantilever detector in high vacuum, maintaining a high Q, while the local NMR properties of nearby aqueous samples in glass microtubes are measured. The entire probe head fits in either a 3.5-cm bore magnet or in an electromagnet with a similarly small gap. We plan to demonstrate the ability to scan and distinguish microscale NMR properties using a copper sulfate solution with concentrations in the 2-20 millimolar range, thus providing dynamical imaging of regions with differing longitudinal relaxation times, T1. This concentration range will permit us to compare the conventional saturation-recovery pulse sequence with a more efficient single-pulse detection, possible when T1 is comparable to or less than the duration of the modified cyclic-adiabatic-inversion pulse.

  15. Lateral tip control effects in critical dimension atomic force microscope metrology: the large tip limit

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald G.; Orji, Ndubuisi G.; Goldband, Ryan S.

    2016-01-01

    Sidewall sensing in critical dimension atomic force microscopes (CD-AFMs) usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezoactuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. Understanding the influence and dependence of the effective tip width on the dither settings and lateral stiffness of the tip can improve the measurement accuracy and uncertainty estimation for CD-AFM measurements. Since CD-AFM typically uses tips that range from 15 to 850 nm in geometrical width, the behavior of effective tip width throughout this range should be understood. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. For tip widths of 130 nm and lower, which also have lower lateral stiffness, the response of the effective tip width to lateral dither is greater than for larger tips. However, we have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To confirm that our prior conclusions about the dependence of effective tip width on lateral stiffness are valid for large CD tips, we recently performed experiments using a very large non-CD tip with an etched plateau of ˜2-μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm/V is the baseline

  16. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

    SciTech Connect

    Steurer, Wolfram Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard

    2014-02-15

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

  17. Sensing cantilever beam bending by the optical lever technique and its application to surface stress.

    PubMed

    Evans, Drew R; Craig, Vincent S J

    2006-03-23

    Cantilever beams, both microscopic and macroscopic, are used as sensors in a great variety of applications. An optical lever system is commonly employed to determine the deflection and thereby the profile of the cantilever under load. The sensitivity of the optical lever must be calibrated, and this is usually achieved by application of a known load or deflection to the free end of the cantilever. When the sensing operation involves a different type of load or a combination of types of loadings, the calibration and the deflection values derived from it become invalid. Here we develop a master equation that permits the true deflection of the cantilever to be obtained simply from the measurement of the apparent deflection for uniformly distributed loadings and end-moment loadings. These loadings are relevant to the uniform adsorption or application of material to the cantilever or the application of a surface stress to the cantilever and should assist experimentalists using the optical lever, such as in the atomic force microscope, to measure cantilever deflections in a great variety of sensing applications. We then apply this treatment to the experimental evaluation of surface stress. Three forms of Stoney's equation that relate the apparent deflection to the surface stress, which is valid for both macroscopic and microscopic experiments, are derived. Analysis of the errors arising from incorrect modeling of the loading conditions of the cantilever currently applied in experiments is also presented. It is shown that the reported literature values for surface stress in microscopic experiments are typically 9% smaller than their true value. For macroscopic experiments, we demonstrate that the added mass of the film or coating generally dominates the measured deflection and must be accounted for accurately if surface stress measurements are to be made. Further, the reported measurements generally use a form of Stoney's equation that is in error, resulting in an

  18. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    ERIC Educational Resources Information Center

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  19. Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics.

    PubMed

    Kageshima, Masami; Chikamoto, Takuma; Ogawa, Tatsuya; Hirata, Yoshiki; Inoue, Takahito; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2009-02-01

    In order to probe dynamical properties of mesoscopic soft matter systems such as polymers, structured liquid, etc., a new atomic force microscopy apparatus with a wide-band magnetic cantilever excitation system was developed. Constant-current driving of an electromagnet up to 1 MHz was implemented with a closed-loop driver circuit. Transfer function of a commercial cantilever attached with a magnetic particle was measured in a frequency range of 1-1000 kHz in distilled water. Effects of the laser spot position, distribution of the force exerted on the cantilever, and difference in the detection scheme on the obtained transfer function are discussed in comparison with theoretical predictions by other research groups. A preliminary result of viscoelasticity spectrum measurement of a single dextran chain is shown and is compared with a recent theoretical calculation. PMID:19256651

  20. Fast nanotopography imaging using a high speed cantilever with integrated heater-thermometer

    NASA Astrophysics Data System (ADS)

    Lee, Byeonghee; Somnath, Suhas; King, William P.

    2013-04-01

    This paper presents a high speed tapping cantilever with an integrated heater-thermometer for fast nanotopography imaging. The cantilever is much smaller and faster than previous heated cantilevers, with a length of 35 μm and a resonant frequency of 1.4 MHz. The mechanical response time is characterized by scanning over a backward-facing step of height 20 nm. The mechanical response time is 77 μs in air and 448 μs in water, which compares favorably to the fastest commercial cantilevers that do not have integrated heaters. The doped silicon cantilever is designed with an integrated heater that can heat and cool in about 10 μs and can operate in both air and water. We demonstrate standard laser-based topography imaging along with thermal topography imaging, when the cantilever is actuated via the piezoelectric shaker in an atomic force microscope system and when it is actuated by Lorentz forces. The cantilever can perform thermal topography imaging in tapping mode with an imaging resolution of 7 nm at a scan speed of 1.46 mm s-1.

  1. Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches

    NASA Astrophysics Data System (ADS)

    Peschot, A.; Vincent, M.; Poulain, C.; Mariolle, D.; Houzé, F.; Delamare, J.

    2015-12-01

    As the reliability of electrical microcontacts has proved to be the main limitation to a fast-growing production of ultraminiaturized switches, a thorough understanding of their failure mechanisms is an all-important purpose. This paper aims at showing that conducting-probe Atomic Force Microscopy (cp-AFM) is an adequate tool to actuate and study electrical contacts. By choosing relevant cantilevers and operating mode of the cp-AFM, dimensions, gap and force level representative of existing microelectromechanical switches (MEMS switches) are obtained. With two examples, the advantages of using a cp-AFM in force mode for studying physical phenomena at very low scale are highlighted. The reported investigations concern material transfer between contact parts and contact bounces. Those two undesirable phenomena induce surface damages and impinge reliability of MEMS switches. In both cases an explanatory scenario of phenomena occurring at nanoscale is proposed and preventive recommendations for improving the lifetime of such devices are suggested.

  2. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  3. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    PubMed

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell. PMID:24007072

  4. Image force microscopy of molecular resonance: A microscope principle

    PubMed Central

    Rajapaksa, I.; Uenal, K.; Wickramasinghe, H. Kumar

    2010-01-01

    We demonstrate a technique in microscopy which extends the domain of atomic force microscopy to optical spectroscopy at the nanometer scale. We show that molecular resonance of feature sizes down to the single molecular level can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole and its mirror image in a platinum coated scanning probe tip. This microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultraviolet. PMID:20859536

  5. Tuning the Spring Constant of Cantilever-free Probe Arrays

    NASA Astrophysics Data System (ADS)

    Eichelsdoerfer, Daniel J.; Brown, Keith A.; Boya, Radha; Shim, Wooyoung; Mirkin, Chad A.

    2013-03-01

    The versatility of atomic force microscope (AFM) based techniques such as scanning probe lithography is due in part to the utilization of a cantilever that can be fabricated to match a desired application. In contrast, cantilever-free scanning probe lithography utilizes a low cost array of probes on a compliant backing layer that allows for high throughput nanofabrication but lacks the tailorability afforded by the cantilever in traditional AFM. Here, we present a method to measure and tune the spring constant of probes in a cantilever-free array by adjusting the mechanical properties of the underlying elastomeric layer. Using this technique, we are able to fabricate large-area silicon probe arrays with spring constants that can be tuned in the range from 7 to 150 N/m. This technique offers an advantage in that the spring constant depends linearly on the geometry of the probe, which is in contrast to traditional cantilever-based lithography where the spring constant varies as the cube of the beam width and thickness. To illustrate the benefit of utilizing a probe array with a lower spring constant, we pattern a block copolymer on a delicate 50 nm thick silicon nitride window.

  6. Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

    SciTech Connect

    Sader, John E.; Yousefi, Morteza; Friend, James R.

    2014-02-15

    Thermal noise spectra of nanomechanical resonators are used widely to characterize their physical properties. These spectra typically exhibit a Lorentzian response, with additional white noise due to extraneous processes. Least-squares fits of these measurements enable extraction of key parameters of the resonator, including its resonant frequency, quality factor, and stiffness. Here, we present general formulas for the uncertainties in these fit parameters due to sampling noise inherent in all thermal noise spectra. Good agreement with Monte Carlo simulation of synthetic data and measurements of an Atomic Force Microscope (AFM) cantilever is demonstrated. These formulas enable robust interpretation of thermal noise spectra measurements commonly performed in the AFM and adaptive control of fitting procedures with specified tolerances.

  7. Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

    NASA Astrophysics Data System (ADS)

    An, Sangmin; Stambaugh, Corey; Kwon, Soyoung; Lee, Kunyoung; Kim, Bongsu; Kim, Qwhan; Jhe, Wonho

    2013-09-01

    We demonstrated the optical microscope (OM) combined with nanopipette-based quartz tuning fork - atomic force microscope (QTF-AFM) for nanolithography. The nanoparticle (Au, 5 nm), nanowire, PDMS solutions are ejected onto the substrate through the nano/microaperture of the pulled pipette, and the nano/microscale objects were in-situ formed on the surface with the proposed patterning system, while the position is defined by monitoring the phenomena on the substrate with a home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano/microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

  8. Compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry Joseph

    2006-08-15

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  9. A complete analysis of the laser beam deflection systems used in cantilever-based systems.

    PubMed

    Beaulieu, L Y; Godin, Michel; Laroche, Olivier; Tabard-Cossa, Vincent; Grütter, Peter

    2007-01-01

    A working model has been developed which can be used to significantly increase the accuracy of cantilever deflection measurements using optical beam techniques (used in cantilever-based sensors and atomic force microscopes), while simultaneously simplifying their use. By using elementary geometric optics and standard vector analysis it is possible, without any fitted or adjustable parameters, to completely and accurately describe the relationship between the cantilever deflection and the signal measured by a position sensitive photo-detector. By arranging the geometry of the cantilever/optical beam, it is possible to tailor the detection system to make it more sensitive at different stages of the cantilever deflection or to simply linearize the relationship between the cantilever deflection and the measured detector signal. Supporting material and software has been made available for download at http://www.physics.mun.ca/beauliu_lab/papers/cantilever_analysis.htm so that the reader may take full advantage of the model presented herein with minimal effort. PMID:17174033

  10. Cancelation of thermally induced frequency shifts in bimaterial cantilevers by nonlinear optomechanical interactions

    NASA Astrophysics Data System (ADS)

    Vy, Nguyen Duy; Tri Dat, Le; Iida, Takuya

    2016-08-01

    Bimaterial cantilevers have recently been used in, for example, the calorimetric analysis with picowatt resolution in microscopic space based on state-of-the-art atomic force microscopes. However, thermally induced effects usually change physical properties of the cantilevers, such as the resonance frequency, which reduce the accuracy of the measurements. Here, we propose an approach to circumvent this problem that uses an optical microcavity formed between a metallic layer coated on the back of the cantilever and one coated at the end of an optical fiber irradiating the cantilever. In addition to increasing the sensitivity, the optical rigidity of this system diminishes the thermally induced frequency shift. For a coating thickness of several tens of nanometers, the input power is 5-10 μW. These values can be evaluated from parameters derived by directly irradiating the cantilever in the absence of the microcavity. The system has the potential of using the cantilever both as a thermometer without frequency shifting and as a sensor with nanometer-controlled accuracy.

  11. High-speed broadband nanomechanical property quantification and imaging of life science materials using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Ren, Juan

    Nanoscale morphological characterization and mechanical properties quantification of soft and biological materials play an important role in areas ranging from nano-composite material synthesis and characterization, cellular mechanics to drug design. Frontier studies in these areas demand the coordination between nanoscale morphological evolution and mechanical behavior variations through simultaneous measurement of these two aspects of properties. Atomic force microscope (AFM) is very promising in achieving such simultaneous measurements at high-speed and broadband owing to its unique capability in applying force stimuli and then, measuring the response at specific locations in a physiologically friendly environment with pico-newton force and nanometer spatial resolution. Challenges, however, arise as current AFM systems are unable to account for the complex and coupled dynamics of the measurement system and probe-sample interaction during high-speed imaging and broadband measurements. In this dissertation, the creation of a set of dynamics and control tools to probe-based high-speed imaging and rapid broadband nanomechanical spectroscopy of soft and biological materials are presented. Firstly, advanced control-based approaches are presented to improve the imaging performance of AFM imaging both in air and in liquid. An adaptive contact mode (ACM) imaging scheme is proposed to replace the traditional contact mode (CM) imaging by addressing the major concerns in both the speed and the force exerted to the sample. In this work, the image distortion caused by the topography tracking error is accounted for in the topography quantification and the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining a stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next

  12. Imaging biological structures with the cryo atomic force microscope.

    PubMed Central

    Zhang, Y; Sheng, S; Shao, Z

    1996-01-01

    It has long been recognized that one of the major limitations in biological atomic force microscopy (AFM) is the softness of most biological samples, which are easily deformed or damaged by the AFM tip, because of the high pressure in the contact area, especially from the very sharp tips required for high resolution. Another is the molecular motion present at room temperature due to thermal fluctuation. Using an AFM operated in liquid nitrogen vapor (cryo-AFM), we demonstrate that cryo-AFM can be applied to a large variety of biological samples, from immunoglobulins to DNA to cell surfaces. The resolution achieved with cryo-AFM is much improved when compared with AFM at room temperature with similar specimens, and is comparable to that of cryo-electron microscopy on randomly oriented macromolecules. We will also discuss the technical problems that remain to be solved for achieving even higher resolution with cryo-AFM and other possible applications of this novel technique. Images FIGURE 1 FIGURE 2 FIGURE 3 FIGURE 4 FIGURE 5 FIGURE 6 FIGURE 7 PMID:8889193

  13. Pressure solution observed with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Colombani, J.; Pachon-Rodriguez, E. A.; Piednoir, A.

    2012-04-01

    Dissolution of minerals is involved in many geological and environmental processes, often with large human consequences. One can cite the durability of mineral materials, the management of nuclear wastes, the sequestration of atmospheric CO2 or the pollution of drinking water. Progresses have been made during the last decade in our understanding of the basic mechanisms of dissolution, particularly concerning the nature of the reactive surface, the role of etch pits, the influence of the mineral history, the mineral replacement processes, ... One of the remaining problems is the influence of an elastic stress on the nature and rate of dissolution. For instance a large discrepancy still exists between experimental results and modelling of pressure solution creep, a plastic strain mechanism of minerals based on the dissolution enhancement by an external stress. We present here an experimental evidence of the influence of a local stress on a molecular elementary mechanism of dissolution. This was performed by atomic force microscopy observation of the migration of a molecular step on the surface of a single crystal of gypsum during dissolution, where the AFM tip is used alternatively to apply a stress and probe the surface. The kinetics of this atomic mechanism is seen to obey the same law of pressure solution as the corresponding macroscopic phenomenon.

  14. Visualization of Cytoskeletal Elements by the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Berdyyeva, Tamara; Woodworth, Craig; Sokolov, Igor

    2004-03-01

    We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane, soluble proteins, and organelles from the cell. The remaining cytoskeleton can then be directly visualized in either liquid or air-dried ambient conditions. These two types of scanning provide complimentary information. Scanning in liquids visualizes the surface filaments of the cytoskeleton, whereas scanning in air shows both the surface filaments and the total volume of the cytoskeletal fibers. The smallest fibers observed were ca. 50 nm in diameter. The lateral resolution of this technique was ca.20 nm, which can be increased to a single nanometer level by choosing sharper AFM tips. Because the AFM is a true 3 dimensional technique, we are able to quantify the observed cytoskeleton by its density and volume. The types of fibers can be identified by their size, similar to electron microscopy.

  15. Characterization of SiO 2/Si with a novel scanning capacitance microscope combined with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Tomiye, Hideto; Kawami, Hiroshi; Yao, Takafumi

    1997-06-01

    We have investigated the local electrical properties of an SiO 2/Si structure using a novel scanning capacitance microscope (SCaM) combined with an atomic force microscope (AFM). The electrical properties of the SiO 2/Si system is investigated using the microscope. We investigated a lateral p-n junction is formed by ion implantation of P into a lightly B-doped Si wafer followed by thermal oxidation. It is demonstrated that the local impurity concentration profiling is achieved by the C—V characteristics. In the next experiment we have injected charge into SiO 2 and investigated the nature of charge storage at the SiO 2/Si interface. Erasing of the written-in pattern was possible by applying a positive pulse. This paper will report on the development of a novel SCaM and its application to the characterization of SiO 2/Si and fabrication of a charge storage device.

  16. Transport spectroscopy of a graphene quantum dot fabricated by atomic force microscope nanolithography

    NASA Astrophysics Data System (ADS)

    Puddy, R. K.; Chua, C. J.; Buitelaar, M. R.

    2013-10-01

    We report low-temperature transport spectroscopy of a graphene quantum dot fabricated by atomic force microscope nanolithography. The excellent spatial resolution of the atomic force microscope allows us to reliably fabricate quantum dots with short constrictions of less than 15 nm in length. Transport measurements demonstrate that the device is dominated by a single quantum dot over a wide gate range. The electron spin system of the quantum dot is investigated by applying an in-plane magnetic field. The results are consistent with a Landé g-factor ˜2 but no regular spin filling sequence is observed, most likely due to disorder.

  17. Indentation of poroviscoelastic vocal fold tissue using an atomic force microscope.

    PubMed

    Heris, Hossein K; Miri, Amir K; Tripathy, Umakanta; Barthelat, Francois; Mongeau, Luc

    2013-12-01

    The elastic properties of the vocal folds (VFs) vary as a function of depth relative to the epithelial surface. The poroelastic anisotropic properties of porcine VFs, at various depths, were measured using atomic force microscopy (AFM)-based indentation. The minimum tip diameter to effectively capture the local properties was found to be 25µm, based on nonlinear laser scanning microscopy data and image analysis. The effects of AFM tip dimensions and AFM cantilever stiffness were systematically investigated. The indentation tests were performed along the sagittal and coronal planes for an evaluation of the VF anisotropy. Hertzian contact theory was used along with the governing equations of linear poroelasticity to calculate the diffusivity coefficient of the tissue from AFM indentation creep testing. The permeability coefficient of the porcine VF was found to be 1.80±0.32×10(-15)m(4)/Ns. PMID:23829979

  18. Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy

    SciTech Connect

    Pratt, Jon R.; Shaw, Gordon A.; Kumanchik, Lee; Burnham, Nancy A.

    2010-02-15

    It has long been recognized that the angular deflection of an atomic force microscope (AFM) cantilever under ''normal'' loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here that a remarkably quantifiable hysteresis occurs in the slope of loading curves whenever the normal flexural stiffness of the AFM cantilever is greater than that of the sample. This situation arises naturally in cantilever-on-cantilever calibration, but also when trying to measure the stiffness of nanomechanical devices or test structures, or when probing any type of surface or structure that is much more compliant along the surface normal than in transverse directions. Expressions and techniques for evaluating the coefficient of sliding friction between the cantilever tip and sample from normal force curves, as well as relations for determining the stiffness of a mechanically compliant specimen are presented. The model is experimentally supported by the results of cantilever-on-cantilever spring constant calibrations. The cantilever spring constants determined here agree with the values determined using the NIST electrostatic force balance within the limits of the largest uncertainty component, which had a relative value of less than 2.5%. This points the way for quantitative testing of micromechanical and nanomechanical components, more accurate calibration of AFM force, and provides nanotribologists access to information about contact friction from normal force curves.

  19. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

    SciTech Connect

    Xie Hui; Vitard, Julien; Haliyo, Sinan; Regnier, Stephane

    2008-03-15

    We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantilever. Conversion factors between the lateral force and photodiode signal using three types of atomic force microscope cantilevers with rectangular geometries (normal spring constants from 0.092 to 1.24 N/m and lateral stiffness from 10.34 to 101.06 N/m) were measured in experiments using the proposed method. When used properly, this method calibrates the conversion factors that are accurate to {+-}12.4% or better. This standard has less error than the commonly used method based on the cantilever's beam mechanics. Methods such of this allow accurate and direct conversion between lateral forces and photodiode signals without any knowledge of the cantilevers and the laser measuring system.

  20. Quasi in situ scanning force microscope with an automatic operated reaction chamber.

    PubMed

    Hund, Markus; Olszowka, Violetta; Fischer, Franz; Krejtschi, Heinz

    2011-11-01

    We describe the design and performance of a quasi in situ scanning force microscope with an automatic operated reaction chamber. The design provides a repetitive hermetically sealed sample environment for successive processing. The reaction chamber is based on a combination of a flexure-guided cover, a piezo-positioning system and a force applicator system. An axial force seals the cover against the reactor enabling flow-through applications at low pressure, ambient pressure, or elevated pressure. The position stability of the sample relative to the probe is characterized and a full automated operation of the instrument is explored by the alignment of an ABC terblock copolymer thin film undergoing solvent vapor annealing in the presence of a high electric field. Due to the high electric field strength and the sharp scanning force microscope tip it is impossible to perform in situ scanning in the presence of the electric field. PMID:22128986

  1. Kinesin force generation measured using a centrifuge microscope sperm-gliding motility assay.

    PubMed Central

    Hall, K; Cole, D; Yeh, Y; Baskin, R J

    1996-01-01

    To measure force generation and characterize the relationship between force and velocity in kinesin-driven motility we have developed a centrifuge microscope sperm-gliding motility assay. The average (extrapolated) value of maximum isometric force at low kinesin density was 0.90 +/- 0.14 pN. Furthermore, in the experiments at low kinesin density, sperm pulled off before stall at forces between 0.40 and 0.75 pN. To further characterize our kinesin-demembranated sperm assay we estimated maximum isometric force using a laser trap-based assay. At low kinesin density, 4.34 +/- 1.5 pN was the maximum force. Using values of axoneme stiffness available from other studies, we concluded that, in our centrifuge microscope-based assay, a sperm axoneme functions as a lever arm, magnifying the centrifugal force and leading to pull-off before stall. In addition, drag of the distal portion of the axoneme is increased by the centrifugal force (because the axoneme is rotated into closer proximity to the glass surface) and represents an additional force that the kinesin motor must overcome. Images FIGURE 1 FIGURE 9 FIGURE 10 PMID:8968616

  2. Biophysical measurements of cells, microtubules, and DNA with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Devenica, Luka M.; Contee, Clay; Cabrejo, Raysa; Kurek, Matthew; Deveney, Edward F.; Carter, Ashley R.

    2016-04-01

    Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here, we review several AFM platforms and describe various biophysical experiments that could be done in the teaching laboratory using these instruments. In particular, we focus on experiments that image biological materials (cells, microtubules, and DNA) and quantify biophysical parameters including membrane tension, persistence length, contour length, and the drag force.

  3. Atomic force microscopic imaging of Acanthamoeba castellanii and Balamuthia mandrillaris trophozoites and cysts.

    PubMed

    Aqeel, Yousuf; Siddiqui, Ruqaiyyah; Ateeq, Muhammad; Raza Shah, Muhammad; Kulsoom, Huma; Khan, Naveed Ahmed

    2015-01-01

    Light microscopy and electron microscopy have been successfully used in the study of microbes, as well as free-living protists. Unlike light microscopy, which enables us to observe living organisms or the electron microscope which provides a two-dimensional image, atomic force microscopy provides a three-dimensional surface profile. Here, we observed two free-living amoebae, Acanthamoeba castellanii and Balamuthia mandrillaris under the phase contrast inverted microscope, transmission electron microscope and atomic force microscope. Although light microscopy was of lower magnification, it revealed functional biology of live amoebae such as motility and osmoregulation using contractile vacuoles of the trophozoite stage, but it is of limited value in defining the cyst stage. In contrast, transmission electron microscopy showed significantly greater magnification and resolution to reveal the ultra-structural features of trophozoites and cysts including intracellular organelles and cyst wall characteristics but it only produced a snapshot in time of a dead amoeba cell. Atomic force microscopy produced three-dimensional images providing detailed topographic description of shape and surface, phase imaging measuring boundary stiffness, and amplitude measurements including width, height and length of A. castellanii and B. mandrillaris trophozoites and cysts. These results demonstrate the importance of the application of various microscopic methods in the biological and structural characterization of the whole cell, ultra-structural features, as well as surface components and cytoskeleton of protist pathogens. PMID:25041405

  4. A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging

    NASA Astrophysics Data System (ADS)

    Wu, Ying; Shi, Jian; Su, Chanmin; Zou, Qingze

    2009-04-01

    In this article, an approach based on the recently developed inversion-based iterative control (IIC) to cancel the cross-axis coupling effect of piezoelectric tube scanners (piezoscanners) in tapping-mode atomic force microscope (AFM) imaging is proposed. Cross-axis coupling effect generally exists in piezoscanners used for three-dimensional (x-y-z axes) nanopositioning in applications such as AFM, where the vertical z-axis movement can be generated by the lateral x-y axes scanning. Such x /y-to-z cross-coupling becomes pronounced when the scanning is at large range and/or at high speed. In AFM applications, the coupling-caused position errors, when large, can generate various adverse effects, including large imaging and topography distortions, and damage of the cantilever probe and/or the sample. This paper utilizes the IIC technique to obtain the control input to precisely track the coupling-caused x /y-to-z displacement (with sign-flipped). Then the obtained input is augmented as a feedforward control to the existing feedback control in tapping-mode imaging, resulting in the cancellation of the coupling effect. The proposed approach is illustrated through two exemplary applications in industry, the pole-tip recession examination, and the nanoasperity measurement on hard-disk drive. Experimental results show that the x /y-to-z coupling effect in large-range (20 and 45 μm) tapping-mode imaging at both low to high scan rates (2, 12.2 to 24.4 Hz) can be effectively removed.

  5. The Analog Atomic Force Microscope: Measuring, Modeling, and Graphing for Middle School

    ERIC Educational Resources Information Center

    Goss, Valerie; Brandt, Sharon; Lieberman, Marya

    2013-01-01

    using an analog atomic force microscope (A-AFM) made from a cardboard box and mailing tubes. Varying numbers of ping pong balls inside the tubes mimic atoms on a surface. Students use a dowel to make macroscale measurements similar to those of a nanoscale AFM tip as it…

  6. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    ERIC Educational Resources Information Center

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  7. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    ERIC Educational Resources Information Center

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  8. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    DOEpatents

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  9. Correlation of embryonic skeletal muscle myotube physical characteristics with contractile force generation on an atomic force microscope-based bio-microelectromechanical systems device

    NASA Astrophysics Data System (ADS)

    Pirozzi, K. L.; Long, C. J.; McAleer, C. W.; Smith, A. S. T.; Hickman, J. J.

    2013-08-01

    Rigorous analysis of muscle function in in vitro systems is needed for both acute and chronic biomedical applications. Forces generated by skeletal myotubes on bio-microelectromechanical cantilevers were calculated using a modified version of Stoney's thin-film equation and finite element analysis (FEA), then analyzed for regression to physical parameters. The Stoney's equation results closely matched the more intensive FEA and the force correlated to cross-sectional area (CSA). Normalizing force to measured CSA significantly improved the statistical sensitivity and now allows for close comparison of in vitro data to in vivo measurements for applications in exercise physiology, robotics, and modeling neuromuscular diseases.

  10. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

    SciTech Connect

    Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter

    2011-11-15

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  11. [Physiological behavior of Cantilever].

    PubMed

    Feeldman, I; Frugone, R; Vládilo, N T

    1990-11-01

    The prosthetic rehabilitation is common of the integral treatment of patients that integral treatment of patients that have lost one or several dental pieces as a consequence of periodontal diseases. It has been demonstrated that plural fixed prothesis to extention, plovide a distribution pattern and magnitude of favourable forces to the periodontal during the different functions of the stomathologic apparatus, that justify rehabilitation based to it patients periodontically affected. The physiological behaviour of cantilever was basically analized on report on different investigation studies performed on patients periodontically diminis hed treated with plural fixed prothesis of crossed are with two unit or bilateral vear cantilever units, dento supported or fixed in place on implants. It is important to emphasize that favourable results previously analized in base to this type of rehabilitation in its different varieties have been obtained through record done on patients in which considerations of indications, design and occlusion stability have been optimized. PMID:2075270

  12. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-01

    The micro-Wilhelmy method is a well-established method of determining surface tension by measuring the force of withdrawing a tens of microns to millimeters in diameter cylindrical wire or fiber from a liquid. A comparison of insertion force to retraction force can also be used to determine the contact angle with the fiber. Given the limited availability of atomic force microscope (AFM) probes that have long constant diameter tips, force-distance (F-D) curves using probes with standard tapered tips have been difficult to relate to surface tension. In this report, constant diameter metal alloy nanowires (referred to as "nanoneedles") between 7.2 and 67 microm in length and 108 and 1006 nm in diameter were grown on AFM probes. F-D and Q damping AFM measurements of wetting and drag forces made with the probes were compared against standard macroscopic models of these forces on slender cylinders to estimate surface tension, contact angle, meniscus height, evaporation rate, and viscosity. The surface tensions for several low molecular weight liquids that were measured with these probes were between -4.2% and +8.3% of standard reported values. Also, the F-D curves show well-defined stair-step events on insertion and retraction from partial wetting liquids, compared to the continuously growing attractive force of standard tapered AFM probe tips. In the AFM used, the stair-step feature in F-D curves was repeatably monitored for at least 0.5 h (depending on the volatility of the liquid), and this feature was then used to evaluate evaporation rates (as low as 0.30 nm/s) through changes in the surface height of the liquid. A nanoneedle with a step change in diameter at a known distance from its end produced two steps in the F-D curve from which the meniscus height was determined. The step features enable meniscus height to be determined from distance between the steps, as an alternative to calculating the height corresponding to the AFM measured values of surface tension and

  13. Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe

    NASA Astrophysics Data System (ADS)

    Seppä, Jeremias; Korpelainen, Virpi; Bergstrand, Sten; Karlsson, Helge; Lillepea, Lauri; Lassila, Antti

    2014-04-01

    An intercomparison of lateral scales of scanning electron microscopes (SEM) and atomic force microscopes (AFM) in various research laboratories in Northern Europe was organized by the local national metrology institutes. In this paper are presented the results of the comparison, with also an example uncertainty budget for AFM grating pitch measurement. Grating samples (1D) were circulated among the participating laboratories. The participating laboratories were also asked about the calibration of their instruments. The accuracy of the uncertainty estimates seemed to vary largely between the laboratories, and for some laboratories the appropriateness of the calibration procedures could be considered. Several institutes (60% of all results in terms of En value) also had good comprehension of their measurement capability. The average difference from reference value was 6.7 and 10.0 nm for calibrated instruments and 20.6 and 39.9 nm for uncalibrated instruments for 300 nm and 700 nm gratings, respectively. The correlation of the results for both nominally 300 and 700 nm gratings shows that a simple scale factor calibration would have corrected a large part of the deviations from the reference values.

  14. Noninvasive determination of optical lever sensitivity in atomic force microscopy

    SciTech Connect

    Higgins, M.J.; Proksch, R.; Sader, J.E.; Polcik, M.; Mc Endoo, S.; Cleveland, J.P.; Jarvis, S.P.

    2006-01-15

    Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever deflection. In this study, we investigate a technique to calibrate the optical lever sensitivity of rectangular cantilevers that does not require contact to be made with a surface. This noncontact approach utilizes the method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] to calibrate the spring constant of the cantilever in combination with the equipartition theorem [J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993)] to determine the optical lever sensitivity. A comparison is presented between sensitivity values obtained from conventional static mode force curves and those derived using this noncontact approach for a range of different cantilevers in air and liquid. These measurements indicate that the method offers a quick, alternative approach for the calibration of the optical lever sensitivity.

  15. Geometric derivation of the microscopic stress: A covariant central force decomposition

    NASA Astrophysics Data System (ADS)

    Torres-Sánchez, Alejandro; Vanegas, Juan M.; Arroyo, Marino

    2016-08-01

    We revisit the derivation of the microscopic stress, linking the statistical mechanics of particle systems and continuum mechanics. The starting point in our geometric derivation is the Doyle-Ericksen formula, which states that the Cauchy stress tensor is the derivative of the free-energy with respect to the ambient metric tensor and which follows from a covariance argument. Thus, our approach to define the microscopic stress tensor does not rely on the statement of balance of linear momentum as in the classical Irving-Kirkwood-Noll approach. Nevertheless, the resulting stress tensor satisfies balance of linear and angular momentum. Furthermore, our approach removes the ambiguity in the definition of the microscopic stress in the presence of multibody interactions by naturally suggesting a canonical and physically motivated force decomposition into pairwise terms, a key ingredient in this theory. As a result, our approach provides objective expressions to compute a microscopic stress for a system in equilibrium and for force-fields expanded into multibody interactions of arbitrarily high order. We illustrate the proposed methodology with molecular dynamics simulations of a fibrous protein using a force-field involving up to 5-body interactions.

  16. Vertically aligned nanostructure scanning probe microscope tips

    SciTech Connect

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  17. Charge Content In Nanometer Rings from Atomic Force Microscope (AFM) Traces

    NASA Astrophysics Data System (ADS)

    Zypman, F.; Eppell, S.; Feinstein, M.; Fried, Y.; Lazarev, D.; Metzger, C.

    The last few years have seen a growing interest in identifying charge content in small structures such as graphene ribbons and aromatic biorings. More generally it is believed that charge content in proteins holds the key to the ultimate understanding of biological self-assembly. Here we describe a model system, a charged ring inside liquid probed by an AFM tip, and show how the charge content and the relative size of the ring with respect to the tip affect the measured force. More importantly, we explain how to measure the charge from the AFM experimental data. The process involves the modeling of the dynamics of the tip-cantilever sensor under the influence of the charged sample, but also of ambient hydrodynamic forces, electrostatic interactions that appear due to charge induction in the tip and electrolytic screening. Of particular relevance is the possibility of our approach to treat analytically the size of ions. This is relevant when the tip-sample distance becomes sub-nanometric, and the more common description via Poisson-Boltzmann equation breaks down. Funding for this research ``Instrument Development: Charge Sensing In Fluids With Nanometer Precision'' is provided by Chemical Measurement & Imaging, National Science Foundation, Grant Number 1508085.

  18. Contact stiffness and damping of liquid films in dynamic atomic force microscope.

    PubMed

    Xu, Rong-Guang; Leng, Yongsheng

    2016-04-21

    The mechanical properties and dissipation behaviors of nanometers confined liquid films have been long-standing interests in surface force measurements. The correlation between the contact stiffness and damping of the nanoconfined film is still not well understood. We establish a novel computational framework through molecular dynamics (MD) simulation for the first time to study small-amplitude dynamic atomic force microscopy (dynamic AFM) in a simple nonpolar liquid. Through introducing a tip driven dynamics to mimic the mechanical oscillations of the dynamic AFM tip-cantilever assembly, we find that the contact stiffness and damping of the confined film exhibit distinct oscillations within 6-7 monolayer distances, and they are generally out-of-phase. For the solid-like film with integer monolayer thickness, further compression of the film before layering transition leads to higher stiffness and lower damping, while much lower stiffness and higher damping occur at non-integer monolayer distances. These two alternating mechanisms dominate the mechanical properties and dissipation behaviors of simple liquid films under cyclic elastic compression and inelastic squeeze-out. Our MD simulations provide a direct picture of correlations between the structural property, mechanical stiffness, and dissipation behavior of the nanoconfined film. PMID:27389229

  19. Contact stiffness and damping of liquid films in dynamic atomic force microscope

    NASA Astrophysics Data System (ADS)

    Xu, Rong-Guang; Leng, Yongsheng

    2016-04-01

    The mechanical properties and dissipation behaviors of nanometers confined liquid films have been long-standing interests in surface force measurements. The correlation between the contact stiffness and damping of the nanoconfined film is still not well understood. We establish a novel computational framework through molecular dynamics (MD) simulation for the first time to study small-amplitude dynamic atomic force microscopy (dynamic AFM) in a simple nonpolar liquid. Through introducing a tip driven dynamics to mimic the mechanical oscillations of the dynamic AFM tip-cantilever assembly, we find that the contact stiffness and damping of the confined film exhibit distinct oscillations within 6-7 monolayer distances, and they are generally out-of-phase. For the solid-like film with integer monolayer thickness, further compression of the film before layering transition leads to higher stiffness and lower damping, while much lower stiffness and higher damping occur at non-integer monolayer distances. These two alternating mechanisms dominate the mechanical properties and dissipation behaviors of simple liquid films under cyclic elastic compression and inelastic squeeze-out. Our MD simulations provide a direct picture of correlations between the structural property, mechanical stiffness, and dissipation behavior of the nanoconfined film.

  20. Energy dissipation mechanisms in microcantilever oscillators with applications to the detection of small forces

    NASA Astrophysics Data System (ADS)

    Yasumura, Kevin Youl

    In 1986 the atomic force microscope (AFM) was invented by Binnig, Quate, and Gerber. Cantilever based force microscopy has been used in a wide range of fields including the study of biological samples, data storage media, and microelectronics. These AFM-based imaging techniques typically measure forces in the piconewton (10-12 N) range. Recent developments in microcantilever fabrication and optical fiber displacement sensors have allowed for the construction of force microscope systems that are capable of measuring forces in the attonewton (10-18 N) range. Applications such as magnetic resonance force microscopy (MRFM) require the cantilevers used to have subattonewton force resolution in order to eventually detect single nuclear spins. It is believed that improvements in cantilever and experimental design will allow for improved force resolution. A fundamental limit to the detection of small forces is thermomechanical noise. The thermal noise force limit, via the fluctuation dissipation theorem, is directly related to the amount of mechanical energy dissipation in the cantilever-based force sensor. Work has therefore been focused on developing an understanding of which mechanisms are limiting the force resolution of these microcantilever oscillators. Arrays of silicon nitride, single-crystal silicon, and polysilicon cantilevers have been fabricated and studied. By measuring the dependence of Q on cantilever material, geometry, and surface treatments, significant insight into the dissipation mechanisms has been obtained. For submicron thick cantilevers, Q is found to decrease with decreasing cantilever thickness, indicative of surface loss mechanisms. For single-crystal silicon cantilevers, significant increase in room temperature Q is obtained after 700 C heat treatment in either N 2 or forming gas. Thermoelastic dissipation is not a factor for submicron thick cantilevers, but is shown to be significant for silicon nitride cantilevers as thin as 2.3 um. At low

  1. Ultrasensitive magnetometry and magnetic resonance imaging using cantilever detection

    NASA Astrophysics Data System (ADS)

    Rugar, Daniel

    2009-03-01

    Micromachined cantilevers make remarkable magnetometers for nanoscale measurements of magnetic materials and for magnetic resonance imaging (MRI). We present various applications of cantilever magnetometry at low temperature using cantilevers capable of attonewton force sensitivity. Small, unexpected magnetic effects can be seen, such as anomalous damping in magnetic field. A key application is magnetic resonance force microscopy (MRFM) of both electron and nuclear spins. In recent experiments with MRFM-based NMR imaging, 3D spatial resolution better than 10 nm was achieved for protons in individual virus particles. The achieved volumetric resolution represents an improvement of 100 million compared to the best conventional MRI. The microscope is sensitive enough to detect NMR signals from adsorbed layers of hydrocarbon contamination, hydrogen in multiwall carbon nanotubes and the phosphorus in DNA. Operating with a force noise on the order of 6 aN per root hertz with a magnetic tip that produces a field gradient in excess of 30 gauss per nanometer, the magnetic moment sensitivity is ˜0.2 Bohr magnetons. The corresponding field sensitivity is ˜3 nT per root hertz. To our knowledge, this combination of high field sensitivity and nanometer spatial resolution is unsurpassed by any other form of nanometer-scale magnetometry.

  2. Scanning force microscope for in situ nanofocused X-ray diffraction studies

    PubMed Central

    Ren, Zhe; Mastropietro, Francesca; Davydok, Anton; Langlais, Simon; Richard, Marie-Ingrid; Furter, Jean-Jacques; Thomas, Olivier; Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume; Boesecke, Peter; Cornelius, Thomas W.

    2014-01-01

    A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials. PMID:25178002

  3. Effect of Magnetic Film Thickness on the Spatial Resolution of Magnetic Force Microscope Tips

    NASA Astrophysics Data System (ADS)

    Nagano, Katsumasa; Tobari, Kousuke; Ohtake, Mitsuru; Futamoto, Masaaki

    2011-07-01

    Magnetic force microscope (MFM) tips were prepared by coating commercial atomic force microscope (AFM) tips of 5 nm radius with Co and CoCrPt magnetic thin films varying the thickness in a range of 10-80 nm. The structural and the magnetic properties of coated magnetic thin films were investigated by scanning electron microscopy, AFM, X-ray diffraction, and vibrating sample magnetometry. The tip radius and the film surface roughness increase with increasing the film thickness. With increasing the film thickness, the MFM signal sensitivity increases, whereas the resolution decreases due to increase of tip radius. The MFM observation resolutions of 10 nm and 23 nm are obtained with the tips coated with 20-nm-thick Co and 40-nm-thick CoCrPt films, respectively. The MFM resolution is influenced by both the tip radius and the magnetic moment of coated material.

  4. Analytical evaluation of describing functions arising from harmonic balance analysis of tapping mode atomic force microscope.

    PubMed

    Mamedov, B A

    2008-05-01

    A new algorithm of harmonic balance analysis of tapping mode atomic force microscopes has been developed. The new algorithm is applicable to analytical evaluation of a large class of common tip-sample interaction potentials. The extensive test calculations show that the proposed algorithm in this work is the efficient one in practical computations. The comparative values presented in tables are acceptable and have the excellent agreement with the numerical results. PMID:18513097

  5. Switched capacitor charge pump used for low-distortion imaging in atomic force microscope.

    PubMed

    Zhang, Jie; Zhang, Lian Sheng; Feng, Zhi Hua

    2015-01-01

    The switched capacitor charge pump (SCCP) is an effective method of linearizing charges on piezoelectric actuators and therefore constitute a significant approach to nano-positioning. In this work, it was for the first time implemented in an atomic force microscope for low-distortion imaging. Experimental results showed that the image quality was improved evidently under the SCCP drive compared with that under traditional linear voltage drive. PMID:25754843

  6. A low temperature scanning tunneling microscope for electronic and force spectroscopy

    SciTech Connect

    Smit, R. H. M.; Grande, R.; Lasanta, B.; Riquelme, J. J.; Rubio-Bollinger, G.; Agraiet, N.

    2007-11-15

    In this article, we describe and test a novel way to extend a low temperature scanning tunneling microscope with the capability to measure forces. The tuning fork that we use for this is optimized to have a high quality factor and frequency resolution. Moreover, as this technique is fully compatible with the use of bulk tips, it is possible to combine the force measurements with the use of superconductive or magnetic tips, advantageous for electronic spectroscopy. It also allows us to calibrate both the amplitude and the spring constant of the tuning fork easily, in situ and with high precision.

  7. Piezoresistive Cantilever Performance—Part II: Optimization

    PubMed Central

    Park, Sung-Jin; Doll, Joseph C.; Rastegar, Ali J.; Pruitt, Beth L.

    2010-01-01

    Piezoresistive silicon cantilevers fabricated by ion implantation are frequently used for force, displacement, and chemical sensors due to their low cost and electronic readout. However, the design of piezoresistive cantilevers is not a straightforward problem due to coupling between the design parameters, constraints, process conditions, and performance. We systematically analyzed the effect of design and process parameters on force resolution and then developed an optimization approach to improve force resolution while satisfying various design constraints using simulation results. The combined simulation and optimization approach is extensible to other doping methods beyond ion implantation in principle. The optimization results were validated by fabricating cantilevers with the optimized conditions and characterizing their performance. The measurement results demonstrate that the analytical model accurately predicts force and displacement resolution, and sensitivity and noise tradeoff in optimal cantilever performance. We also performed a comparison between our optimization technique and existing models and demonstrated eight times improvement in force resolution over simplified models. PMID:20333323

  8. Tribological characteristics of ZnO nanowires investigated by atomic force microscope

    NASA Astrophysics Data System (ADS)

    Chung, Koo-Hyun; Kim, Hyun-Joon; Lin, Li-Yu; Kim, Dae-Eun

    2008-08-01

    Zinc oxide (ZnO) nanowires have attracted great interest in nanodevices. In this work, the tribological characteristics of vertically grown ZnO nanowires obtained by metalorganic chemical vapor deposition were investigated by using an atomic force microscope (AFM). The ZnO nanowires were slid against flattened silicon and diamond-coated AFM probes under 50 150 nN normal force while monitoring the frictional force. The wear of the ZnO nanowires was observed by a scanning electron microscope and quantified based on Archard’s wear law. Also, the wear debris accumulated on the silicon probe was analyzed by using a transmission electron microscope (TEM). The results showed that the wear of ZnO nanowires slid against the silicon probe was extremely small. However, when the ZnO nanowires were slid against the diamond-coated probe, the wear coefficients ranged from 0.006 to 0.162, which correspond to the range of severe wear at the macroscale. It was also shown that the friction coefficient decreased from 0.30 to 0.25 as the sliding cycles increased. From TEM observation, it was found that the ZnO wear debris was mainly amorphous in structure. Also, crystalline ZnO nanoparticles were observed among the wear debris.

  9. Analysis of beam interference reflected from atomic force microscope tip and periodic silicon surface under various humidity conditions

    NASA Astrophysics Data System (ADS)

    Banerjee, Hans P.; Weerasinghe, Asanka T.; Lyuksyutov, Sergei F.

    2012-10-01

    Dynamical sensing based on combination of classical optical effects and atomic force microscopy (AFM) presents challenge for analysis of the forces at the nanoscale and beyond. An interference effect between light reflected from an AFM cantilever and highly reflective silicon surface of the calibration grating was studied for relative humidity (RH) varied between 9 and 60%. Force-distance analysis indicates on separation of capillary, van der Waals, adhesion, and electrostatic forces. The measurements performed in contact AFM mode suggest that the period of interference pattern observed in displacement curves is a function of humidity and varies between 293 nm at RH = 9% and 335 nm at RH > 50% with standard deviation less than 8 nm. Clear change of the interference period suggests that other than hardwarerelated factors may be involved in the formation of the interference in force-distance curves.

  10. Computer Simulation of the Forces Acting on the Polystyrene Probe Submerged into the Succinonitrile Near Phase Transition

    NASA Technical Reports Server (NTRS)

    Bune, Andris V.; Kaukler, William F.; Whitaker, Ann F. (Technical Monitor)

    2001-01-01

    Modeling approach to simulate both mesoscale and microscopic forces acting in a typical AFM experiment is presented. At mesoscale level interaction between the cantilever tip and the sample surface is primarily described by the balance of attractive Van der Waals and repulsive forces. The model of cantilever oscillations is applicable to both non-contact and "tapping" AFM. This model can be farther enhanced to describe nanoparticle manipulation by cantilever. At microscopic level tip contamination and details of tip-surface interaction can be simulated using molecular dynamics approach. Integration of mesoscale model with molecular dynamic model is discussed.

  11. Nanomachining by rubbing at ultrasonic frequency under controlled shear force.

    PubMed

    Muraoka, Mikio

    2011-03-01

    This study proposes a new method of proximal-probe machining that uses a rubbing process by introducing concentrated-mass (CM) cantilevers. At the second resonance of the CM cantilever vibration, the tip site of the cantilever becomes a node of the standing deflection wave because of the sufficient inertia of the attached concentrated mass. The tip makes a cyclic motion that is tangential to the sample surface, not vertical to it, as in a tapping motion. This lateral tip motion that is selectively excited by CM cantilevers was effective for the material modification of a sample due to the friction between the tip and the sample. Imaging and nanomachining under controlled shear force were demonstrated by means of the modified cantilever and a normal atomic force microscope. We were able to write a micron-sized letter "Z" having a line width of 30-100 nm on a resin surface. PMID:21449337

  12. Molecular self-assembly of conducting polymer by Conducting Probe Technique in Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Yamamoto, Shin-ichi; Ogawa, Kazufumi

    2007-04-01

    A polypyrrole derivative monolayer was investigated for the application as a wire. First, a pyrrole derivative monolayer was prepared by chemically adsorbing (self-assembling) monolayer (CAM) of 6-pyrrolylhexyl-12,12,12-trichloro-12- siladodecanoate (PEN) on a glass substrate. Then, the monolayer was polymerized in the presence of pure water by electrooxidation. The surface characterization of the molecular interaction was investigated by measuring the properties of CAMs attached to the glass substrate in the lateral direction. We formed PEN having polypyrrolyl groups, using Pt-patterned electrodes on glass surfaces and measured the conductance under a small bias voltage, using a conductive cantilever of atomic force microscopy (AFM). The polypyrrole derivative monolayer thus synthesized was covalently bonded to the glass substrate and showed conductivity as high as 3.05..103 S/cm after electro-oxidized. The method of preparing a conductive polymer monolayer by the combining chemical adsorption and electro-oxidation leads to a lot molecular wire to perpendicular to the Pt electrodes, and it is one of the key technologies for molecular devices.

  13. A new method to measure the oscillation of a cylindrical cantilever: ``The laser reflection detection system''

    NASA Astrophysics Data System (ADS)

    Antognozzi, M.; Haschke, H.; Miles, M. J.

    2000-04-01

    A new optical detection system for measuring the oscillation of cylindrical cantilevers has been designed. A laser beam is directed perpendicularly to the oscillating plane and is focused on the curved surface of the vibrating probe. The surface reflects the light and a second lens refocuses it onto a two-segment photodiode. The sensitivity of this method lies in the fact that a small displacement of the probe produces a large angular deflection of the reflected laser. Applications of this new system are presented in order to demonstrate its reliability, accuracy, sensitivity, and the possible use in a shear force microscope. All the results are finally analyzed by modeling the motion of the cantilevers using harmonic oscillator theory and the continuous model for oscillating bars. The agreement between experimental data and models is well inside the experimental errors confirming the possibility of using this system to accurately study the dynamics of cylindrical cantilevers.

  14. Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement.

    PubMed

    Paolino, P; Bellon, L

    2009-10-01

    We measure the mechanical thermal noise of soft silicon atomic force microscope cantilevers. Using an interferometric setup, we obtain a resolution down to 10(-14) m Hz(-1/2) on a wide spectral range (3-10(5) Hz). The low frequency behavior depends dramatically on the presence of a reflective coating: almost flat spectra for uncoated cantilevers versus a 1/f like trend for coated ones. The addition of a viscoelastic term in models of the mechanical system can account for this observation. Use of Kramers-Kronig relations validate this approach with a complete determination of the response of the cantilever: a power law with a small coefficient is found for the frequency dependence of viscoelasticity due to the coating, whereas the viscous damping due to the surrounding atmosphere is accurately described by the Sader model. PMID:19738311

  15. Probing the interaction between air bubble and sphalerite mineral surface using atomic force microscope.

    PubMed

    Xie, Lei; Shi, Chen; Wang, Jingyi; Huang, Jun; Lu, Qiuyi; Liu, Qingxia; Zeng, Hongbo

    2015-03-01

    The interaction between air bubbles and solid surfaces plays important roles in many engineering processes, such as mineral froth flotation. In this work, an atomic force microscope (AFM) bubble probe technique was employed, for the first time, to directly measure the interaction forces between an air bubble and sphalerite mineral surfaces of different hydrophobicity (i.e., sphalerite before/after conditioning treatment) under various hydrodynamic conditions. The direct force measurements demonstrate the critical role of the hydrodynamic force and surface forces in bubble-mineral interaction and attachment, which agree well with the theoretical calculations based on Reynolds lubrication theory and augmented Young-Laplace equation by including the effect of disjoining pressure. The hydrophobic disjoining pressure was found to be stronger for the bubble-water-conditioned sphalerite interaction with a larger hydrophobic decay length, which enables the bubble attachment on conditioned sphalerite at relatively higher bubble approaching velocities than that of unconditioned sphalerite. Increasing the salt concentration (i.e., NaCl, CaCl2) leads to weakened electrical double layer force and thereby facilitates the bubble-mineral attachment, which follows the classical Derjaguin-Landau-Verwey-Overbeek (DLVO) theory by including the effects of hydrophobic interaction. The results provide insights into the basic understanding of the interaction mechanism between bubbles and minerals at nanoscale in froth flotation processes, and the methodology on probing the interaction forces of air bubble and sphalerite surfaces in this work can be extended to many other mineral and particle systems. PMID:25675101

  16. Determination of Base Binding Strength and Base Stacking Interaction of DNA Duplex Using Atomic Force Microscope

    PubMed Central

    Zhang, Tian-biao; Zhang, Chang-lin; Dong, Zai-li; Guan, Yi-fu

    2015-01-01

    As one of the most crucial properties of DNA, the structural stability and the mechanical strength are attracting a great attention. Here, we take advantage of high force resolution and high special resolution of Atom Force Microscope and investigate the mechanical force of DNA duplexes. To evaluate the base pair hydrogen bond strength and base stacking force in DNA strands, we designed two modes (unzipping and stretching) for the measurement rupture forces. Employing k-means clustering algorithm, the ruptured force are clustered and the mean values are estimated. We assessed the influence of experimental parameters and performed the force evaluation for DNA duplexes of pure dG/dC and dA/dT base pairs. The base binding strength of single dG/dC and single dA/dT were estimated to be 20.0 ± 0.2 pN and 14.0 ± 0.3 pN, respectively, and the base stacking interaction was estimated to be 2.0 ± 0.1 pN. Our results provide valuable information about the quantitative evaluation of the mechanical properties of the DNA duplexes. PMID:25772017

  17. Cellular level nanomanipulation using atomic force microscope aided with superresolution imaging

    NASA Astrophysics Data System (ADS)

    Chacko, Jenu Varghese; Harke, Benjamin; Canale, Claudio; Diaspro, Alberto

    2014-10-01

    Atomic force microscopes (AFM) provide topographical and mechanical information of the sample with very good axial resolution, but are limited in terms of chemical specificity and operation time-scale. An optical microscope coupled to an AFM can recognize and target an area of interest using specific identification markers like fluorescence tags. A high resolution fluorescence microscope can visualize fluorescence structures or molecules below the classical optical diffraction limit and reach nanometer scale resolution. A stimulated emission depletion (STED) microscopy superresolution (SR) microscope coupled to an AFM is an example in which the AFM tip gains nanoscale manipulation capabilities. The SR targeting and visualization ability help in fast and specific identification of subdiffraction-sized cellular structures and manoeuvring the AFM tip onto the target. We demonstrate how to build a STED AFM and use it for biological nanomanipulation aided with fast visualization. The STED AFM based bionanomanipulation is presented for the first time in this article. This study points to future nanosurgeries performable at single-cell level and a physical targeted manipulation of cellular features as it is currently used in research domains like nanomedicine and nanorobotics.

  18. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces.

    PubMed

    Klapetek, Petr; Ohlídal, Ivan; Bílek, Jindrich

    2004-12-01

    In this paper, the influence of atomic force microscope tip on the multifractal analysis of rough surfaces is discussed. This analysis is based on two methods, i.e. on the correlation function method and the wavelet transform modulus maxima method. The principles of both methods are briefly described. Both methods are applied to simulated rough surfaces (simulation is performed by the spectral synthesis method). It is shown that the finite dimensions of the microscope tip misrepresent the values of the quantities expressing the multifractal analysis of rough surfaces within both the methods. Thus, it was concretely shown that the influence of the finite dimensions of the microscope tip changed mono-fractal properties of simulated rough surface to multifractal ones. Further, it is shown that a surface reconstruction method developed for removing the negative influence of the microscope tip does not improve the results obtained in a substantial way. The theoretical procedures concerning both the methods, i.e. the correlation function method and the wavelet transform modulus maxima method, are illustrated for the multifractal analysis of randomly rough gallium arsenide surfaces prepared by means of the thermal oxidation of smooth gallium arsenide surfaces and subsequent dissolution of the oxide films. PMID:15556700

  19. Microscopic theory of the Casimir force at thermal equilibrium: large-separation asymptotics.

    PubMed

    Buenzli, P R; Martin, Ph A

    2008-01-01

    We present an entirely microscopic calculation of the Casimir force f(d) between two metallic plates in the limit of large separation d . The models of metals consist of mobile quantum charges in thermal equilibrium with the photon field at positive temperature T . Fluctuations of all degrees of freedom, matter and field, are treated according to the principles of quantum electrodynamics and statistical physics without recourse to approximations or intermediate assumptions. Our main result is the correctness of the asymptotic universal formula f(d) approximately -zeta(3)kBT/8pid3, d-->infinity. This supports the fact that, in the framework of the Lifshitz theory of electromagnetic fluctuations, transverse electric modes do not contribute in this regime. Moreover, the microscopic origin of universality is seen to rely on perfect screening sum rules that hold in great generality for conducting media. PMID:18351825

  20. Simulation and signal analysis of Akiyama probe applied to atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wang, Longlong; Lu, Mingzhen; Guo, Tong; Gao, Sitian; Zhang, Huakun

    2013-10-01

    Atomic force microscope is one of indispensable measurement tools in nano/micronano precision manufacture and critical dimension measurement. To expand its industry application, a novel head and system are newly designed combined with Nanosensors cooperation's patented probe — Akiyama probe, which is a self-sensing probe. The modal analysis and resonance frequency are obtained by finite element(FE) simulations. Using the Locked-in amplifier, the effective and available signal can be abtained. Through the experiment analysis, the retracting and extending curve reflects the tip and sample interaction. Furthermore, the measurement on the calibrated position system demonstrates that the whole system resolution can reach the nanometer scale.

  1. Measuring Single Particle Microrheology of Human Mucus Using the 3D Force Microscope

    NASA Astrophysics Data System (ADS)

    Cribb, Jeremy; Hill, D. B.; Taylor, R.; O'Brien, E. T.; Davis, C. W.; Matsui, H.; Vicci, L.; Matthews, G.; Fisher, J.; Desai, K. V.; Wilde, B.; Superfine, R.

    2003-11-01

    In many patients with Cystic Fibrosis, the viscosity of mucus is higher than that found in normal patients, contributing to the failure of cilia to sweep mucus away from the lungs effectively. Microrheological measurements of biologically relevant fluids, such as mucus, are important to understand the physical environment in which cilia operate. The complex viscoelastic moduli and apparent viscosity of several mucus concentrations were determined by tracking 1 micron beads undergoing Brownian motion. Further, the apparent viscosity of each mucus solution was determined from the Stokes' drag on a superparamagnetic bead driven by the 3-dimensional force microscope (3DFM).

  2. Mapping flexible protein domains at subnanometer resolution with the atomic force microscope.

    PubMed

    Müller, D J; Fotiadis, D; Engel, A

    1998-06-23

    The mapping of flexible protein domains with the atomic force microscope is reviewed. Examples discussed are the bacteriorhodopsin from Halobacterium salinarum, the head-tail-connector from phage phi29, and the hexagonally packed intermediate layer from Deinococcus radiodurans which all were recorded in physiological buffer solution. All three proteins undergo reversible structural changes that are reflected in standard deviation maps calculated from aligned topographs of individual protein complexes. Depending on the lateral resolution (up to 0.8 nm) flexible surface regions can ultimately be correlated with individual polypeptide loops. In addition, multivariate statistical classification revealed the major conformations of the protein surface. PMID:9678604

  3. Inorganic resist materials based on zirconium phosphonate for atomic force microscope lithography

    NASA Astrophysics Data System (ADS)

    Kang, Mankyu; Kim, Seonae; Jung, JinHyuck; Kim, Heebom; Shin, Inkyun; Jeon, Chanuk; Lee, Haiwon

    2014-03-01

    New inorganic resist materials based on metal complexes were investigated for atomic force microscope (AFM) lithography. Phosphoric acids are good for self-assembly because of their strong binding energy. In this work, zirconium phosphonate system are newly synthesized for spin-coatable materials in aqueous solutions and leads to negative tone pattern for improving line edge roughness. Low electron exposure by AFM lithography could generate a pattern by electrochemical reaction and cross-linking of metal-oxo complexes. It has been reported that the minimum pattern results are affected by lithographic speed, and the applied voltage between a tip and a substrate.

  4. An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.

    PubMed

    Vitorino, M V; Fuchs, Y; Dane, T; Rodrigues, M S; Rosenthal, M; Panzarella, A; Bernard, P; Hignette, O; Dupuy, L; Burghammer, M; Costa, L

    2016-09-01

    A compact high-speed X-ray atomic force microscope has been developed for in situ use in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized. PMID:27577764

  5. Dynamic Behavior in Piezoresponse Force Microstopy

    SciTech Connect

    Jesse, Stephen; Baddorf, Arthur P; Kalinin, Sergei V

    2006-01-01

    Frequency-dependent dynamic behavior in piezoresponse force microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analysed using a combination of modelling and experimental measurements. The PFM signal is comprised of contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the flexural and torsional oscillations of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric parameters of the system, on the stiffnesses and frictional forces of the tip-surface junction, and on the frequency of operation. The dynamic signal formation mechanism in PFM is analysed and conditions for optimal PFM imaging are formulated. An experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented

  6. Dynamic behaviour in piezoresponse force microscopy.

    PubMed

    Jesse, Stephen; Baddorf, Arthur P; Kalinin, Sergei V

    2006-03-28

    Frequency-dependent dynamic behaviour in piezoresponse force microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analysed using a combination of modelling and experimental measurements. The PFM signal is comprised of contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the flexural and torsional oscillations of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric parameters of the system, on the stiffnesses and frictional forces of the tip-surface junction, and on the frequency of operation. The dynamic signal formation mechanism in PFM is analysed and conditions for optimal PFM imaging are formulated. An experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented. PMID:26558568

  7. Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory

    SciTech Connect

    Elzbieciak-Wodka, Magdalena; Ruiz-Cabello, F. Javier Montes; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal; Popescu, Mihail N.

    2014-03-14

    Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10{sup −21} J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

  8. Demonstration of an electrostatic-shielded cantilever

    SciTech Connect

    Pingue, P.; Piazza, V.; Baschieri, P.; Ascoli, C.; Menozzi, C.; Alessandrini, A.; Facci, P.

    2006-01-23

    The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si{sub 3}N{sub 4} cantilever chip is presented. Nanomachining and metal deposition induced by focused ion beam techniques were employed in order to modify the original insulating pyramidal tip and insert a conducting metallic tip. Two parallel metallic electrodes deposited on the original cantilever arms are employed for tip biasing and as ground plane in order to minimize the electrostatic force due to the capacitive interaction between cantilever and sample surface. Excitation spectra and force-to-distance characterization are shown with different electrode configurations. Applications of this scheme in electrostatic force microscopy, Kelvin probe microscopy and local anodic oxidation is discussed.

  9. Interfacial force sensor with force-feedback control

    SciTech Connect

    Joyce, S.A.; Houston, J.E.; Smith, B.K.

    1990-01-01

    A new interfacial force microscope capable of measuring the forces between two surfaces over the entire range of surface separations, up to contact, has been developed. The design is centered around a differential capacitance displacement sensor where the common capacitor plate is supported by torsion bars. A force-feedback control system balances the interfacial forces at the sensor, maintaining the common capacitor plate at its rest position. This control eliminates the instability which occurs with the conventional cantilever-based force sensors when the attractive force gradient exceeds the mechanical stiffness of the cantilever. The ability to measure interfacial forces at surface separations smaller than this instability point using the feedback control is demonstrated. 11 refs., 3 figs.

  10. Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

    NASA Astrophysics Data System (ADS)

    Park, J. G.; Lee, S. H.; Kim, B.; Park, Y. W.

    2002-12-01

    Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as a template. Its size depends on the pore diameter of template, range from 50 to 200 nm. Direct I-V measurements of PPy nanotube (diameter of 120 nm) deposited on Au were done using a metal-coated tapping-mode atomic-force-microscope tip. Linear I-V characteristics are observed, and the resistance is decreased as the contact force is increased. Using the Hertz model, the elastic modulus E and electrical resistivity ρ are estimated to be E˜1 GPa and ρ˜1 Ωcm. These values are consistent with those obtained in bulk PPy film.

  11. Propulsive force of Paramecium as revealed by the video centrifuge microscope.

    PubMed

    Kuroda, K; Kamiya, N

    1989-09-01

    Using the video centrifuge microscope we constructed, we observed the behavior of Paramecium cells in a solution of graded densities under centrifugal acceleration. Beyond 300g, they not only gather in the zone where the density is closest to theirs, but also orient themselves with their longitudinal axis parallel to the direction of centrifugation turning their anterior ends toward either centripetal or centrifugal direction. Since all of them retain still active swimming capacity, it is possible to calculate their propulsive force from the difference in density between theirs (1.04 g cm-3) and that of the upper or lower layer which they can reach. The propulsive force of single Paramecium cells thus obtained was calculated to be about 7 x 10(-4) dyn. PMID:2792228

  12. Atomic force microscopic measurement of the mechanical properties of intact endothelial cells in fresh arteries.

    PubMed

    Miyazaki, H; Hayashi, K

    1999-07-01

    Mechanical properties of living endothelial cells in the abdominal aortas and in the medial and lateral wall of aortic bifurcations obtained from rabbits were determined by means of an atomic force microscope (AFM), focusing on the locational differences. Force (F)-indentation (delta) curves of the cells were expressed by an exponential function: F = a(exp(b delta)-1), where a and b are constants. The parameters b and c(= ab) represent the rate of modulus change and initial modulus, respectively. The slope of F-delta curves a and the parameter c were higher in the medial wall than in the other sites, which is attributable to abundant stress fibres in endothelial cells in the medial wall. There were no differences in the parameter b among the three locations. These results indicate that endothelial cells are stiffer in the medial wall of aortic bifurcation than in the other regions. PMID:10696714

  13. Imaging and manipulating molecules on a zeolite surface with an atomic force microscope

    SciTech Connect

    Weisenhorn, A.L.; MacDougall, J.E.; Gould, S.A.C.; Cox, S.D.; Wise, W.S.; Stucky, G.D.; Hansma, P.K. ); Massie, J.; Maivald, P.; Elings, V.B. )

    1990-03-16

    The adsorption of neutral molecules and ions on the surfaces of zeolites was observed in real time with an atomic force microscope (AFM). Direct imaging of the surface of the zeolite clinoptilolite was possible by using a diluted tert-butyl ammonium chloride solution as a medium. Images of the crystal in different liquids revealed that molecules could be bound to the surface in different ways; neutral molecules of tert-butanol formed an ordered array, whereas tert-butyl ammonium ions formed clusters. These absorbed molecules were not rearranged by the AFM tip when used in an imaging mode. However, when a sufficiently large force was applied, the tip of the AFM could rearrange the tert-butyl ammoniium ions on the zeolite surface. This demonstration of molecular manipulation suggests new applications, including biosensors and lithography. 31 refs., 2 figs.

  14. Imaging and Manipulating Molecules on a Zeolite Surface with an Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Weisenhorn, A. L.; Mac Dougall, J. E.; Gould, S. A. C.; Cox, S. D.; Wise, W. S.; Massie, J.; Maivald, P.; Elings, V. B.; Stucky, G. D.; Hansma, P. K.

    1990-03-01

    The adsorption of neutral molecules and ions on the surfaces of zeolites was observed in real time with an atomic force microscope (AFM). Direct imaging of the surface of the zeolite clinoptilolite was possible by using a diluted tert-butyl ammonium chloride solution as a medium. Images of the crystal in different liquids revealed that molecules could be bound to the surface in different ways; neutral molecules of tert-butanol formed an ordered array, whereas tert-butyl ammonium ions formed clusters. These absorbed molecules were not rearranged by the AFM tip when used in an imaging mode. However, when a sufficiently large force was applied, the tip of the AFM could rearrange the tert-butyl ammonium ions on the zeolite surface. This demonstration of molecular manipulation suggests new applications, including biosensors and lithography.

  15. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

    SciTech Connect

    Schwarz, Udo; Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

    2008-02-27

    The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

  16. Cantilever clamp fitting

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B. (Inventor)

    1989-01-01

    A device is disclosed for sealing and clamping a cylindrical element which is to be attached to an object such as a wall, a pressurized vessel or another cylindrical element. The device includes a gland having an inner cylindrical wall, which is threaded at one end and is attached at a bendable end to a deformable portion, which in turn is attached to one end of a conical cantilever structure. The other end of the cantilever structure connects at a bendable area to one end of an outer cylindrical wall. The opposite end of cylindrical wall terminates in a thickened portion, the radially outer surface of which is adapted to accommodate a tool for rotating the gland. The terminal end of cylindrical wall also includes an abutment surface, which is adapted to engage a seal, which in turn engages a surface of a receiver. The receiver further includes a threaded portion for engagement with the threaded portion of gland whereby a tightening rotation of gland relative to receiver will cause relative movement between cylindrical walls and of gland. This movement causes a rotation of the conical structure and thus a bending action at bending area and at the bending end of the upper end of inner cylindrical wall. These rotational and bending actions result in a forcing of the deformable portion radially inwardly so as to contact and deform a pipe. This forcible contact creates a seal between gland and pipe, and simultaneously clamps the pipe in position.

  17. A microscopic approach to Casimir and Casimir-Polder forces between metallic bodies

    NASA Astrophysics Data System (ADS)

    Barcellona, Pablo; Passante, Roberto

    2015-04-01

    We consider the Casimir-Polder interaction energy between a metallic nanoparticle and a metallic plate, as well as the Casimir interaction energy between two macroscopic metal plates, in terms of the many-body dispersion interactions between their constituents. Expressions for two- and three-body dispersion interactions between the microscopic parts of a real metal are first obtained, both in the retarded and non-retarded limits. These expressions are then used to evaluate the overall two- and three-body contributions to the macroscopic Casimir-Polder and Casimir force, and to compare them with each other, for the two following geometries: metal nanoparticle/half-space and half-space/half-space, where all the materials are assumed perfect conductors. The above evaluation is obtained by summing up the contributions from the microscopic constituents of the bodies (metal nanoparticles). In the case of nanoparticle/half-space, our results fully agree with those that can be extracted from the corresponding macroscopic results, and explicitly show the non-applicability of the pairwise approximation for the geometry considered. In both cases, we find that, while the overall two-body contribution yields an attractive force, the overall three-body contribution is repulsive. Also, they turn out to be of the same order, consistently with the known non applicability of the pairwise approximation. The issue of the rapidity of convergence of the many-body expansion is also briefly discussed.

  18. A microscopic approach to Casimir and Casimir–Polder forces between metallic bodies

    SciTech Connect

    Barcellona, Pablo Passante, Roberto

    2015-04-15

    We consider the Casimir–Polder interaction energy between a metallic nanoparticle and a metallic plate, as well as the Casimir interaction energy between two macroscopic metal plates, in terms of the many-body dispersion interactions between their constituents. Expressions for two- and three-body dispersion interactions between the microscopic parts of a real metal are first obtained, both in the retarded and non-retarded limits. These expressions are then used to evaluate the overall two- and three-body contributions to the macroscopic Casimir–Polder and Casimir force, and to compare them with each other, for the two following geometries: metal nanoparticle/half-space and half-space/half-space, where all the materials are assumed perfect conductors. The above evaluation is obtained by summing up the contributions from the microscopic constituents of the bodies (metal nanoparticles). In the case of nanoparticle/half-space, our results fully agree with those that can be extracted from the corresponding macroscopic results, and explicitly show the non-applicability of the pairwise approximation for the geometry considered. In both cases, we find that, while the overall two-body contribution yields an attractive force, the overall three-body contribution is repulsive. Also, they turn out to be of the same order, consistently with the known non applicability of the pairwise approximation. The issue of the rapidity of convergence of the many-body expansion is also briefly discussed.

  19. A wireless centrifuge force microscope (CFM) enables multiplexed single-molecule experiments in a commercial centrifuge.

    PubMed

    Hoang, Tony; Patel, Dhruv S; Halvorsen, Ken

    2016-08-01

    The centrifuge force microscope (CFM) was recently introduced as a platform for massively parallel single-molecule manipulation and analysis. Here we developed a low-cost and self-contained CFM module that works directly within a commercial centrifuge, greatly improving accessibility and ease of use. Our instrument incorporates research grade video microscopy, a power source, a computer, and wireless transmission capability to simultaneously monitor many individually tethered microspheres. We validated the instrument by performing single-molecule force shearing of short DNA duplexes. For a 7 bp duplex, we observed over 1000 dissociation events due to force dependent shearing from 2 pN to 12 pN with dissociation times in the range of 10-100 s. We extended the measurement to a 10 bp duplex, applying a 12 pN force clamp and directly observing single-molecule dissociation over an 85 min experiment. Our new CFM module facilitates simple and inexpensive experiments that dramatically improve access to single-molecule analysis. PMID:27587129

  20. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research.

    PubMed

    Zhong, Jian; He, Dannong

    2015-01-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future. PMID:26265357

  1. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    PubMed Central

    Zhong, Jian; He, Dannong

    2015-01-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future. PMID:26265357

  2. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    NASA Astrophysics Data System (ADS)

    Zhong, Jian; He, Dannong

    2015-08-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future.

  3. Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.

    PubMed

    Cumpson, P J Peter J; Zhdan, Peter; Hedley, John

    2004-08-01

    Calibration of the spring constant of atomic force microscope (AFM) cantilevers is necessary for the measurement of nanonewton and piconewton forces, which are critical to analytical applications of AFM in the analysis of polymer surfaces, biological structures and organic molecules. We have developed a compact and easy-to-use reference standard for this calibration. The new artifact consists of an array of 12 dual spiral-cantilever springs, each supporting a mirrored polycrystalline silicon disc of 160 microm in diameter. These devices were fabricated by a three-layer polysilicon surface micromachining method, including a reflective layer of gold on chromium. We call such an array a Microfabricated Array of Reference Springs (MARS). These devices have a number of advantages. Cantilever calibration using this device is straightforward and rapid. The devices have very small inertia, and are therefore resistant to shock and vibration. This means they need no careful treatment except reasonably clean laboratory conditions. The array spans the range of spring constant from around 0.16 to 11 N/m important in AFM, allowing almost all contact-mode AFM cantilevers to be calibrated easily and rapidly. Each device incorporates its own discrete gold mirror to improve reflectivity. The incorporation of a gold mirror both simplifies calibration of the devices themselves (via Doppler velocimetry) and allows interferometric calibration of the AFM z-axis using the apparent periodicity in the force-distance curve before contact. Therefore, from a single force-distance curve, taking about one second to acquire, one can calibrate the cantilever spring constant and, optionally, the z-axis scale. These are all the data one needs to make accurate and reliable force measurements. PMID:15231316

  4. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    NASA Astrophysics Data System (ADS)

    Wagner, Ryan; Killgore, Jason P.

    2015-11-01

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  5. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    SciTech Connect

    Wagner, Ryan Killgore, Jason P.

    2015-11-16

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  6. Self-reciprocating radioisotope-powered cantilever

    NASA Astrophysics Data System (ADS)

    Li, Hui; Lal, Amit; Blanchard, James; Henderson, Douglass

    2002-07-01

    A reciprocating cantilever utilizing emitted charges from a millicurie radioisotope thin film is presented. The actuator realizes a direct collected-charge-to-motion conversion. The reciprocation is obtained by self-timed contact between the cantilever and the radioisotope source. A static model balancing the electrostatic and mechanical forces from an equivalent circuit leads to an analytical solution useful for device characterization. Measured reciprocating periods agree with predicted values from the analytical model. A scaling analysis shows that microscale arrays of such cantilevers provide an integrated sensor and actuator platform.

  7. Getting Physical with Your Chemistry: Mechanically Investigating Local Structure and Properties of Surfaces with the Atomic Force Microscope

    ERIC Educational Resources Information Center

    Heinz, William F.; Hoh, Jan H.

    2005-01-01

    Atomic force microscope (AFM) investigates mechanically the chemical properties of individual molecules, surfaces, and materials using suitably designed probes. The current state of the art of AFM in terms of imaging, force measurement, and sample manipulation and its application to physical chemistry is discussed.

  8. Piezoelectric cantilever sensors

    NASA Technical Reports Server (NTRS)

    Shih, Wan Y. (Inventor); Shih, Wei-Heng (Inventor); Shen, Zuyan (Inventor)

    2008-01-01

    A piezoelectric cantilever with a non-piezoelectric, or piezoelectric tip useful as mass and viscosity sensors. The change in the cantilever mass can be accurately quantified by monitoring a resonance frequency shift of the cantilever. For bio-detection, antibodies or other specific receptors of target antigens may be immobilized on the cantilever surface, preferably on the non-piezoelectric tip. For chemical detection, high surface-area selective absorbent materials are coated on the cantilever tip. Binding of the target antigens or analytes to the cantilever surface increases the cantilever mass. Detection of target antigens or analytes is achieved by monitoring the cantilever's resonance frequency and determining the resonance frequency shift that is due to the mass of the adsorbed target antigens on the cantilever surface. The use of a piezoelectric unimorph cantilever allows both electrical actuation and electrical sensing. Incorporating a non-piezoelectric tip (14) enhances the sensitivity of the sensor. In addition, the piezoelectric cantilever can withstand damping in highly viscous liquids and can be used as a viscosity sensor in wide viscosity range.

  9. Indentation quantification for in-liquid nanomechanical measurement of soft material using an atomic force microscope: Rate-dependent elastic modulus of live cells

    NASA Astrophysics Data System (ADS)

    Ren, Juan; Yu, Shiyan; Gao, Nan; Zou, Qingze

    2013-11-01

    In this paper, a control-based approach to replace the conventional method to achieve accurate indentation quantification is proposed for nanomechanical measurement of live cells using atomic force microscope. Accurate indentation quantification is central to probe-based nanomechanical property measurement. The conventional method for in-liquid nanomechanical measurement of live cells, however, fails to accurately quantify the indentation as effects of the relative probe acceleration and the hydrodynamic force are not addressed. As a result, significant errors and uncertainties are induced in the nanomechanical properties measured. In this paper, a control-based approach is proposed to account for these adverse effects by tracking the same excitation force profile on both a live cell and a hard reference sample through the use of an advanced control technique, and by quantifying the indentation from the difference of the cantilever base displacement in these two measurements. The proposed control-based approach not only eliminates the relative probe acceleration effect with no need to calibrate the parameters involved, but it also reduces the hydrodynamic force effect significantly when the force load rate becomes high. We further hypothesize that, by using the proposed control-based approach, the rate-dependent elastic modulus of live human epithelial cells under different stress conditions can be reliably quantified to predict the elasticity evolution of cell membranes, and hence can be used to predict cellular behaviors. By implementing the proposed approach, the elastic modulus of HeLa cells before and after the stress process were quantified as the force load rate was changed over three orders of magnitude from 0.1 to 100 Hz, where the amplitude of the applied force and the indentation were at 0.4-2 nN and 250-450 nm, respectively. The measured elastic modulus of HeLa cells showed a clear power-law dependence on the load rate, both before and after the stress

  10. Indentation quantification for in-liquid nanomechanical measurement of soft material using an atomic force microscope: rate-dependent elastic modulus of live cells.

    PubMed

    Ren, Juan; Yu, Shiyan; Gao, Nan; Zou, Qingze

    2013-11-01

    In this paper, a control-based approach to replace the conventional method to achieve accurate indentation quantification is proposed for nanomechanical measurement of live cells using atomic force microscope. Accurate indentation quantification is central to probe-based nanomechanical property measurement. The conventional method for in-liquid nanomechanical measurement of live cells, however, fails to accurately quantify the indentation as effects of the relative probe acceleration and the hydrodynamic force are not addressed. As a result, significant errors and uncertainties are induced in the nanomechanical properties measured. In this paper, a control-based approach is proposed to account for these adverse effects by tracking the same excitation force profile on both a live cell and a hard reference sample through the use of an advanced control technique, and by quantifying the indentation from the difference of the cantilever base displacement in these two measurements. The proposed control-based approach not only eliminates the relative probe acceleration effect with no need to calibrate the parameters involved, but it also reduces the hydrodynamic force effect significantly when the force load rate becomes high. We further hypothesize that, by using the proposed control-based approach, the rate-dependent elastic modulus of live human epithelial cells under different stress conditions can be reliably quantified to predict the elasticity evolution of cell membranes, and hence can be used to predict cellular behaviors. By implementing the proposed approach, the elastic modulus of HeLa cells before and after the stress process were quantified as the force load rate was changed over three orders of magnitude from 0.1 to 100 Hz, where the amplitude of the applied force and the indentation were at 0.4-2 nN and 250-450 nm, respectively. The measured elastic modulus of HeLa cells showed a clear power-law dependence on the load rate, both before and after the stress

  11. Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope

    NASA Astrophysics Data System (ADS)

    Kokavecz, J.; Tóth, Z.; Horváth, Z. L.; Heszler, P.; Mechler, Á.

    2006-04-01

    Frequency-modulated atomic force microscopy (FM-AFM; also called non-contact atomic force microscopy) is the prevailing operation mode in (sub-)atomic resolution vacuum applications. A major obstacle that prohibits a wider application range is the low frame capture rate. The speed of FM-AFM is limited by the low bandwidth of the automatic gain control (AGC) and frequency demodulation loops. In this work we describe a novel algorithm that can be used to overcome these weaknesses. We analysed the settling times of the proposed loops and that of the complete system, and we found that an approximately 70-fold improvement can be achieved over the existing real and virtual atomic force microscopes. We show that proportional-integral-differential controllers perform better in the frequency demodulation loop than conventional proportional-integral controllers. We demonstrate that the signal to noise ratio of the proposed system is 5.7 × 10-5, which agrees with that of the conventional systems; thus, the new algorithm would improve the performance of FM-AFMs without compromising the resolution.

  12. The cantilever fixed partial denture--a literature review.

    PubMed

    Himmel, R; Pilo, R; Assif, D; Aviv, I

    1992-04-01

    The cantilever fixed partial denture (FPD) is a restoration with one or more abutments at one end and unsupported at the other end. Forces transmitted through the cantilevered pontics can cause tilting and rotational movements of the abutments. In a cross-arch unilateral cantilever FPD, the distal cantilevered unit is subjected to comparatively less force than the contralateral posterior abutment. The unilateral lack of terminal abutments causes lateral bending forces activate peripheral inhibitory feedback reactions from the periodontal and/or temporomandibular mechanoreceptors. The greatest strain in distal cantilevered FPDs is recorded mesial to the most distal retainer because most fractures occur in this location. To improve the prognosis of the FPD cantilever, the number of abutments should be increased and the number of pontics decreased. The abutment teeth need long roots and acceptable alveolar support. Prepared abutments require adequate length and parallel axial walls. An equilibrated and harmonious occlusion is necessary, as well as exemplary oral hygiene. A cantilevered FPD with adequate periodontal support can replace any tooth in the dental arch, but is especially useful as an alternative to a removable partial denture. The cantilevered FPD requires at least two abutment teeth. The only documented exception permitting a single abutment is the replacement of a maxillary lateral incisor with the canine as an abutment. An alternative to the cantilevered FPD is the osseointegrated implant. As osseointegrated implants become more popular, the need for the tooth-supported cantilevered FPD may decline, but it will remain an alternative treatment modality. PMID:1507130

  13. Non-contact quantification of laser micro-impulse in water by atomic force microscopy and its application for biomechanics

    NASA Astrophysics Data System (ADS)

    Hosokawa, Yoichiroh

    2011-12-01

    We developed a local force measurement system of a femtosecond laser-induced impulsive force, which is due to shock and stress waves generated by focusing an intense femtosecond laser into water with a highly numerical aperture objective lens. In this system, the force localized in micron-sized region was detected by bending movement of a cantilever of atomic force microscope (AFM). Here we calculated the bending movement of the AFM cantilever when the femtosecond laser is focused in water at the vicinity of the cantilever and the impulsive force is loaded on the cantilever. From the result, a method to estimate the total of the impulsive force at the laser focal point was suggested and applied to estimate intercellular adhesion strength.

  14. Growth of single gold nanofilaments at the apex of conductive atomic force microscope tips.

    PubMed

    Bakhti, S; Destouches, N; Hubert, C; Reynaud, S; Vocanson, F; Ondarçuhu, T; Epicier, T

    2016-04-14

    This paper describes a fast and one-step technique to grow single gold filaments at the apex of commercial conductive AFM tips. It is implemented with an atomic force microscope in air with a high relative humidity at room temperature and is based on a bias-assisted electro-reduction of gold ions directly at the tip apex. The technique requires only ad hoc substrates made of a mesoporous silica layer loaded with gold salt deposited on a conductive electrode. It leads to the growth, at the tip apex, of filaments whose length can be monitored and controlled during the growth between tens and hundreds of nanometers and whose radius of curvature can be as low as 3 nm. Made of polycrystalline gold nanostructures, the filaments are chemically and mechanically stable and conductive. PMID:26848043

  15. Simulation of Tip-Sample Interaction in the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    Good, Brian S.; Banerjea, Amitava

    1994-01-01

    Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.

  16. Growth of single gold nanofilaments at the apex of conductive atomic force microscope tips

    NASA Astrophysics Data System (ADS)

    Bakhti, S.; Destouches, N.; Hubert, C.; Reynaud, S.; Vocanson, F.; Ondarçuhu, T.; Epicier, T.

    2016-03-01

    This paper describes a fast and one-step technique to grow single gold filaments at the apex of commercial conductive AFM tips. It is implemented with an atomic force microscope in air with a high relative humidity at room temperature and is based on a bias-assisted electro-reduction of gold ions directly at the tip apex. The technique requires only ad hoc substrates made of a mesoporous silica layer loaded with gold salt deposited on a conductive electrode. It leads to the growth, at the tip apex, of filaments whose length can be monitored and controlled during the growth between tens and hundreds of nanometers and whose radius of curvature can be as low as 3 nm. Made of polycrystalline gold nanostructures, the filaments are chemically and mechanically stable and conductive.

  17. Characterization of a thermoset-thermoplastic interphase using the atomic force microscope

    SciTech Connect

    Gruber, N.D.; Lesko, J.J.; Harris, L.A.

    1996-12-31

    Recent investigators have shown that the performance of polymer matrix composites can be significantly enhanced by using fibers sized with a thermoplastic polymer. This increase in performance is a result of the sizing material interacting with the matrix resin to form an interphase: a region possessing a gradient in properties different from the sizing material and the matrix resin. Although the influence of the sizing (interphase) on laminate properties has been well documented, quantitative information regarding interphase properties is absent. In this study, {open_quotes}model{close_quotes} composites consisting of polyurethane sized carbon fibers embedded in a vinyl ester matrix were fabricated to characterize the interphase. The atomic force microscope was used to identify the interphase region in these {open_quotes}model{close_quotes} composites.

  18. The MIDAS atomic force microscope for cometary dust: technical highlights and future perspectives

    NASA Astrophysics Data System (ADS)

    Torkar, K.; Riedler, W.; Romstedt, J.; Jeszenszky, H.; Steller, M.; Arends, H.

    2003-04-01

    The instrument MIDAS (Micro-Imaging Dust Analysis System) aboard the Rosetta Orbiter is to produce three-dimensional images of dust grain samples from the cometary coma at a resolution down to a few nanometers. Images at this resolution will help to understand the formation processes of cometary material. The instrument will also provide statistical information on the dust population, including size distribution, shapes and flux. MIDAS combines a system for dust collection and target manipulation with an atomic force microscope. The instrument has been developed to a flight model which is ready for launch. The paper reviews the capabilities of the instrument in the upcoming mission, and highlights the most advanced technical solutions to achieve the high requirements on resolution, accuracy and reliability.

  19. Toolkit for the Automated Characterization of Optical Trapping Forces on Microscopic Particles

    NASA Astrophysics Data System (ADS)

    Glaser, Joseph; Hoeprich, David; Resnick, Andrew

    2014-03-01

    Optical traps have been in use in microbiological studies for the past 40 years to obtain noninvasive control of microscopic particles. However, the magnitude of the applied forces is often unknown. Therefore, we have developed an automated data acquisition and processing system which characterizes trap properties for known particle geometries. Extensive experiments and measurements utilizing well-characterized objects were performed and compared to literature to confirm the system's performance. This system will enable the future analysis of a trapped primary cilium, a slender rod-shaped organelle with aspect ratio L/R >30, where `L' is the cilium length and `R' the cilium diameter. The trapping of cilia is of primary importance, as it will lead to the precise measurements of mechanical properties of the organelle and its significance to the epithelial cell. Support from the National Institutes of Health, 1R15DK092716 is gratefully acknowledged.

  20. Atomic force microscope observation of branching in single transcript molecules derived from human cardiac muscle

    NASA Astrophysics Data System (ADS)

    Reed, Jason; Hsueh, Carlin; Mishra, Bud; Gimzewski, James K.

    2008-09-01

    We have used an atomic force microscope to examine a clinically derived sample of single-molecule gene transcripts, in the form of double-stranded cDNA, (c: complementary) obtained from human cardiac muscle without the use of polymerase chain reaction (PCR) amplification. We observed a log-normal distribution of transcript sizes, with most molecules being in the range of 0.4-7.0 kilobase pairs (kb) or 130-2300 nm in contour length, in accordance with the expected distribution of mRNA (m: messenger) sizes in mammalian cells. We observed novel branching structures not previously known to exist in cDNA, and which could have profound negative effects on traditional analysis of cDNA samples through cloning, PCR and DNA sequencing.

  1. Modification of calcite crystal growth by abalone shell proteins: an atomic force microscope study.

    PubMed Central

    Walters, D A; Smith, B L; Belcher, A M; Paloczi, G T; Stucky, G D; Morse, D E; Hansma, P K

    1997-01-01

    A family of soluble proteins from the shell of Haliotis rufescens was introduced over a growing calcite crystal being scanned in situ by an atomic force microscope (AFM). Atomic step edges on the crystal surface were altered in shape and speed of growth by the proteins. Proteins attached nonuniformly to the surface, indicating different interactions with crystallographically different step edges. The observed changes were consistent with the habit modification induced by this family of proteins, as previously observed by optical microscopy. To facilitate further studies in this area, AFM techniques and certain AFM imaging artifacts are discussed in detail. Images FIGURE 1 FIGURE 3 FIGURE 4 FIGURE 5 FIGURE 6 FIGURE 8 FIGURE 9 PMID:9138588

  2. High-throughput automatic defect review for 300mm blank wafers with atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zandiatashbar, Ardavan; Kim, Byong; Yoo, Young-kook; Lee, Keibock; Jo, Ahjin; Lee, Ju Suk; Cho, Sang-Joon; Park, Sang-il

    2015-03-01

    While feature size in lithography process continuously becomes smaller, defect sizes on blank wafers become more comparable to device sizes. Defects with nm-scale characteristic size could be misclassified by automated optical inspection (AOI) and require post-processing for proper classification. Atomic force microscope (AFM) is known to provide high lateral and the highest vertical resolution by mechanical probing among all techniques. However, its low throughput and tip life in addition to the laborious efforts for finding the defects have been the major limitations of this technique. In this paper we introduce automatic defect review (ADR) AFM as a post-inspection metrology tool for defect study and classification for 300 mm blank wafers and to overcome the limitations stated above. The ADR AFM provides high throughput, high resolution, and non-destructive means for obtaining 3D information for nm-scale defect review and classification.

  3. Drift reduction in a scanning electrostatic force microscope for surface profile measurement

    NASA Astrophysics Data System (ADS)

    Jia, Zhigang; Ito, So; Goto, Shigeaki; Hosobuchi, Keiichiro; Shimizu, Yuki; Gao, Wei

    2014-09-01

    The influence of drifts on the measurement results of an electrostatic force microscope (EFM) based on a dual-height method for surface profile measurement is analyzed. Two types of drifts and their influence on the EFM measurement are discussed by computer simulation. It is figured out that the mechanical drift has a larger impact compared to the resonance frequency drift for the specific EFM with the conventional round-trip scan mode. It is also verified that the profile reconstruction algorithm of the dual-height method for separating the electric property distribution and the surface profile of the surface has an effect of magnifying the drift error in the result of surface profile measurement, which is a much more significant measurement of uncertainty sources for the developed EFM compared with an ordinary scanning probe microscope (SPM). A new vertical reciprocating scan (VRS) mode is then employed to reduce the influences of the drifts. The feasibility of the VRS mode is demonstrated by computer simulation and measurement experiments with a diffraction grating.

  4. Nano-imaging collagen by atomic force, near-field and nonlinear microscope

    NASA Astrophysics Data System (ADS)

    Lim, Ken Choong; Tang, Jinkai; Li, Hao; Ng, Boon Ping; Kok, Shaw Wei; Wang, Qijie; Zhang, Ying

    2015-03-01

    As the most abundant protein in the human body, collagen has a very important role in vast numbers of bio-medical applications. The unique second order nonlinear properties of fibrillar collagen make it a very important index in nonlinear optical imaging based disease diagnosis of the brain, skin, liver, colon, kidney, bone, heart and other organs in the human body. The second-order nonlinear susceptibility of collagen has been explored at the macroscopic level and was explained as a volume-averaged molecular hyperpolarizability. However, details about the origin of optical second harmonic signals from collagen fibrils at the molecular level are still not clear. Such information is necessary for accurate interpolation of bio-information from nonlinear optical imaging techniques. The later has shown great potential in collagen based disease diagnosis methodologies. In this paper, we report our work using an atomic force microscope (AFM), near field (SNOM) and nonlinear laser scanning microscope (NLSM) to study the structure of collagen fibrils and other pro-collagen structures.

  5. The structure of cometary dust - first results from the MIDAS Atomic Force Microscope onboard Rosetta

    NASA Astrophysics Data System (ADS)

    Bentley, M. S.; Torkar, K.; Romstedt, J.

    2014-12-01

    A decade after launch the European Space Agency's Rosetta spacecraft has finally arrived at comet 67P/Churyumov-Gerasimenko. Unlike previous cometary missions, Rosetta is not a flyby, limited to taking a snapshot of the comet at a single heliocentric distance. Instead, Rosetta intercepted the comet prior to the onset of major activity and will chart its evolution during its perihelion passage and beyond. Such a unique mission requires a unique payload; as well as the more typical remote sensing instruments, Rosetta also carries sensors to sample in situ the gas and dust environment. One of these instruments is MIDAS, an atomic force microscope designed to collect dust and image it in three dimensions with nanometre resolution. Equipped with an array of sharp tips, four of which are magnetised to allow magnetic force microscopy, MIDAS exposes targets to the incident flux after which they are moved to the microscope for analysis. As well as extending coverage of the dust size distribution down to the finest particles, MIDAS has the unique capability to determine the shape of pristine particles - to determine, for example, if they are compact or fluffy, and to look for features which may be diagnostic of their formation environment or evolution. The magnetic mode lets MIDAS probe samples for magnetic material and to map its location if present. Having been operating almost continuously after hibernation imaging empty targets before exposure, the first exposures were performed when Rosetta entered 30 km bound orbits. The first MIDAS images and analyses of collected dust grains are presented here.

  6. Measurements of laboratory turbulence with the 2d-Laser Cantilever Anemometer

    NASA Astrophysics Data System (ADS)

    Puczylowski, Jaroslaw; Peinke, Joachim; Hoelling, Michael

    2013-11-01

    A newly developed anemometer, the 2d-Laser Cantilever Anemometer, was used to measure the two-dimensional wind speed vector in laboratory-generated turbulence. The anemometer provides a temporal and spatial resolution comparable or even higher to those of commercial hot-wires and thus is an excellent alternative for high-resolution measurements. The 2d-Laser Cantilever Anemometer uses a previously unseen measurement technique in the range of anemometers. The principle is adopted from atomic force microscopes (AFM). A tiny micro-structured cantilever is brought into the airflow, where it experiences a drag force due to the moving fluid. The resulting deflection is measured using the laser pointer principle. Unlike the measuring principle of hot-wires this technique can be applied in challenging environments such as in liquids or very close to walls. Our comparing measurements with the 2d-Laser Cantilever Anemometer and an x-wire were carried out in the wake of rigid bodies and grids. The results show a great agreement with regards to the increment statistics on various scales, power spectra and turbulence intensity, thus proving the new anemometer.

  7. Insight into mechanics of AFM tip-based nanomachining: bending of cantilevers and machined grooves.

    PubMed

    Al-Musawi, R S J; Brousseau, E B; Geng, Y; Borodich, F M

    2016-09-23

    Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study describes an important phenomenon specific for AFM nanomachining in the forward direction: under certain processing conditions, the deformed shape of the cantilever probe may change from a convex to a concave orientation. The phenomenon can principally change the depth and width of grooves machined, e.g. the grooves machined on a single crystal copper specimen may increase by 50% on average following such a change in the deformed shape of the cantilever. It is argued that this phenomenon can take place even when the AFM-based tool is operated in the so-called force-controlled mode. The study involves the refined theoretical analysis of cantilever probe bending, the analysis of experimental signals monitored during the backward and forward AFM tip-based machining and the inspection of the topography of produced grooves. PMID:27532247

  8. Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source

    SciTech Connect

    Hund, Markus; Herold, Hans

    2007-06-15

    We describe the design and performance of an atomic force microscope (AFM) combined with a miniaturized inductively coupled plasma source working at a radio frequency of 27.12 MHz. State-of-the-art scanning probe microscopes (SPMs) have limited in situ sample treatment capabilities. Aggressive treatments such as plasma etching or harsh treatments such as etching in aggressive liquids typically require the removal of the sample from the microscope. Consequently, time consuming procedures are required if the same sample spot has to be imaged after successive processing steps. We have developed a first prototype of a SPM which features a quasi in situ sample treatment using a modified commercial atomic force microscope. A sample holder is positioned in a special reactor chamber; the AFM tip can be retracted by several millimeters so that the chamber can be closed for a treatment procedure. Most importantly, after the treatment, the tip is moved back to the sample with a lateral drift per process step in the 20 nm regime. The performance of the prototype is characterized by consecutive plasma etching of a nanostructured polymer film.

  9. Calibration of frictional forces in atomic force microscopy

    SciTech Connect

    Ogletree, D.F.; Carpick, R.W.; Salmeron, M.

    1996-09-01

    The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an {ital in} {ital situ} experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. {copyright} {ital 1996 American Institute of Physics.}

  10. Micromachined Silicon Cantilever Magnetometry.

    NASA Astrophysics Data System (ADS)

    Chaparala, M. V.

    1998-03-01

    Magnetic torque measurements give us a simple and attractive method for characterizing the anisotropic properties of magnetic materials. Silicon torque and force magnetometers have many advantages over traditional torsion fiber torque magnetometers. We have fabricated micromachined silicon torque and force magnetometers employing both capacitive(``Capacitance platform magnetometer for thin film and small crystal superconductor studies'', M. Chaparala et al.), AIP Conf. Proc. (USA), AIP Conference Proceedings, no.273, p. 407 1993. and strain dependent FET detection(``Strain Dependent Characterstics of Silicon MOSFETs and their Applications'', M. Chaparala et al.), ISDRS Conf. Proc. 1997. schemes which realize some of these gains. We will present the pros and cons of each of the different detection schemes and the associated design constraints. We have developed a feedback scheme which enables null detection thus preserving the integrity of the sample orientation. We will present a method of separating out the torque and force terms in the measured signals and will discuss the errors associated with each of the designs. Finally, we present the static magnetic torque measurements on various materials with these devices, including equilibrium properties on sub microgram specimens of superconductors, and dHvA measurements near H_c2. We will also discuss their usefulness in pulsed magnetic fields(``Cantilever magnetometry in pulsed magnetic fields", M. J. Naughton et al.), Rev. of Sci. Instrum., vol.68, p. 4061 1997..

  11. Cantilevered carbon nanotube hygrometer

    NASA Astrophysics Data System (ADS)

    Kuroyanagi, Toshinori; Terada, Yuki; Takei, Kuniharu; Akita, Seiji; Arie, Takayuki

    2014-05-01

    We investigate the effects of humidity on the vibrations of carbon nanotubes (CNTs) using two types of CNT cantilevers: open-ended and close-ended CNT cantilevers. As the humidity increases, the resonant frequency of the open-ended CNT cantilever decreases due to the adsorption of water molecules onto the CNT tip, whereas that of the close-ended CNT cantilever increases probably due to the change in the viscosity of the air surrounding the CNT cantilever, which is negatively correlated with the humidity of air. Our findings suggest that a close-ended CNT cantilever is more suitable for a quick-response and ultrasensitive hygrometer because it continuously reads the viscosity change of moist air in the vicinity of the CNT.

  12. Magnetic force microscope tip-induced remagnetization of CoPt nanodisks with perpendicular anisotropy

    NASA Astrophysics Data System (ADS)

    Mironov, V. L.; Gribkov, B. A.; Vdovichev, S. N.; Gusev, S. A.; Fraerman, A. A.; Ermolaeva, O. L.; Shubin, A. B.; Alexeev, A. M.; Zhdan, P. A.; Binns, C.

    2009-09-01

    We report on the results of a magnetic force microscopy investigation of remagnetization processes in arrays of CoPt nanodisks with diameters of 35 and 200 nm and a thickness of 9.8 nm fabricated by e-beam lithography and ion etching. The controllable magnetization reversal of individual CoPt nanodisks by the magnetic force microscope (MFM) tip-induced magnetic field was demonstrated. We observed experimentally two essentially different processes of tip-induced remagnetization. Magnetization reversal of 200 nm disks was observed when the probe moved across the particle while in case of 35 nm nanodisks one-touch remagnetization was realized. Micromagnetic modeling based on the Landau-Lifshitz-Gilbert (LLG) equation demonstrated that the tip-induced magnetization reversal occurs through the essentially inhomogeneous states. Computer simulations confirmed that in case of 200 nm disks the mechanism of embryo nucleation with reversed magnetization and further dynamic propagation following the probe moving across the particle was realized. On the other hand one-touch remagnetization of 35 nm disks occurs through the inhomogeneous vortexlike state. Micromagnetic LLG simulations showed that magnetization reversal in an inhomogeneous MFM probe field has a lower energy barrier in comparison with the mechanism of coherent rotation, which takes place in a homogeneous external magnetic field.

  13. Frictional Behavior of Micro/nanotextured Surfaces Investigated by Atomic Force Microscope: a Review

    NASA Astrophysics Data System (ADS)

    Zhang, Xiaoliang; Jia, Junhong

    2015-08-01

    Tribological issues between friction pair are fundamental problems for minimized devices because of their higher surface-to-volume ratio. Micro/nanotexturing is an effective technique to reduce actual contact area between contact pair at the nanoscale. Micro/nanotexture made a great impact on the frictional behavior of textured surfaces. This paper summarizes the recent advancements in the field of frictional behavior of micro/nanotextured surfaces, which are based on solid surface contact in atmosphere environment, especially focusing on the factors influencing the frictional behavior: Surface property, texturing density, texturing height, texturing structure and size of contact pair (atomic force microscope (AFM) tip) and texturing structures. Summarizing the effects of these factors on the frictional behavior is helpful for the understanding and designing of the surfaces in sliding micro/nanoelectromechanical systems (MEMS/NEMS). Controlling and reducing the friction force in moving mechanical systems is very important for the performance and reliability of nanosystems, which contribute to a sustainable future.

  14. Determination of the elastic properties of tomato fruit cells with an atomic force microscope.

    PubMed

    Zdunek, Artur; Kurenda, Andrzej

    2013-01-01

    Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young's modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm) showed that the measured elastic properties were significantly affected by tip geometry. The Young's modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100%) among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale. PMID:24030683

  15. Calibration of an interfacial force microscope for MEMS metrology : FY08-09 activities.

    SciTech Connect

    Houston, Jack E.; Baker, Michael Sean; Crowson, Douglas A.; Mitchell, John Anthony; Moore, Nathan W.

    2009-10-01

    Progress in MEMS fabrication has enabled a wide variety of force and displacement sensing devices to be constructed. One device under intense development at Sandia is a passive shock switch, described elsewhere (Mitchell 2008). A goal of all MEMS devices, including the shock switch, is to achieve a high degree of reliability. This, in turn, requires systematic methods for validating device performance during each iteration of design. Once a design is finalized, suitable tools are needed to provide quality assurance for manufactured devices. To ensure device performance, measurements on these devices must be traceable to NIST standards. In addition, accurate metrology of MEMS components is needed to validate mechanical models that are used to design devices to accelerate development and meet emerging needs. Progress towards a NIST-traceable calibration method is described for a next-generation, 2D Interfacial Force Microscope (IFM) for applications in MEMS metrology and qualification. Discussed are the results of screening several suitable calibration methods and the known sources of uncertainty in each method.

  16. Adhesion, friction and wear characterization of skin and skin cream using atomic force microscope.

    PubMed

    Tang, Wei; Bhushan, Bharat

    2010-03-01

    Skin cream is commonly used to improve skin health and create a smooth, soft, and moist perception by altering the surface roughness, friction, and adhesion of skin surface. In this study, a systematic characterization of the friction and adhesion properties of skin and skin cream was carried out, which is essential to develop better skin care products and advance biological, dermatology, and cosmetic science. Since cream rheology is expected to be a function of its thickness as well as the velocity and normal load during its application, friction and adhesion experiments were performed at a range of cream film thickness, velocity, and normal load in order to study their effect on virgin skin and cream treated skin. Since environmental dependence of skin and skin cream is of importance, the effect of relative humidity and temperature on the coefficient of friction and adhesive force was also studied. Durability of the virgin skin and cream treated skin was studied by repeated cycling tests. These experiments were performed by using an atomic force microscope (AFM) and a macroscale friction test apparatus in order to study the scale effects. Friction and wear mechanisms under various operating conditions are discussed. PMID:19879737

  17. Characterization of the cutting edge of glass and diamond knives for ultramicrotomy by scanning force microscopy using cantilevers with a defined tip geometry. Part II.

    PubMed

    Matzelle, T R; Gnaegi, H; Ricker, A; Reichelt, R

    2003-02-01

    The cutting edge of glass as well as diamond knives was studied at high resolution using a scanning force microscope (SFM). The local shape of the cutting edge was estimated from single line profiles of the SFM topographs taking into account the exact shape of the probing tip estimated by a high-resolution field emission scanning electron microscope (FESEM). The glass knives were prepared by 'balanced breaking'. The radius of the investigated cutting edges was found to be 3.2-4.4 nm and 4.3-6.0 nm for the 35 degrees and 45 degrees diamond knife, respectively, and 3.4-4.3 nm for the glass knives. Besides the opening angle and the cutting edge radius, the friction of a knife during sectioning represents a significant factor influencing the quality of sections. Thus, the roughness of both the diamond clearance angle side and the back side was characterized as well. Corresponding RMS values of the roughness were found to be smaller on the back side (approximately 0.14 nm) than on the clearance angle side (approximately 0.26 nm). PMID:12588528

  18. Double sided surface stress cantilever sensor

    NASA Astrophysics Data System (ADS)

    Rasmussen, P. A.; Grigorov, A. V.; Boisen, A.

    2005-05-01

    Micromachined cantilevers, originally developed for use in atomic force microscopy, are gaining more and more interest as biochemical sensors, where the way in which the binding of chemical species changes the mechanical properties of the cantilever is utilized. Mass and stiffness changes are measured on resonating structures (Cherian and Thundat 2002 Appl. Phys. Lett. 80 2219-21 Gupta et al 2004 Appl. Phys. Lett. 84 1976-8), whereas changes in surface energy from the binding event are measured as static deflections of cantilevers (Savran et al 2004 Anal. Chem. 76 3194-8). The latter measurement type is referred to as a surface stress sensor and it is the description of a new and more sensitive cantilever surface stress measurement technique that is the topic of this paper.

  19. Force-noise spectroscopy by tunneling current deflection sensing

    NASA Astrophysics Data System (ADS)

    Herz, Markus; Scheer, Elke

    2016-01-01

    An electro-mechanical setup for the measurement of force-noise properties in a low-temperature tunneling microscope has been utilized to enable extremely high resolution and acquire force-noise spectra as function of the applied voltage bias. The direct crosstalk of vibrations onto the tunneling current is used to measure the deflection of a force-sensing cantilever. We demonstrate its capability to measure the mechanical energy of the cantilever, caused by the noise of the force from vacuum tunneling between polycrystalline Iridium electrodes. We observe peak levels of the induced cantilever energy at polarity-symmetric voltages corresponding to dominant peaks of the phonon density of states, which suggests that inelastic transport processes contribute to force fluctuations.

  20. 3-D Raman Imagery and Atomic Force Microscopy of Ancient Microscopic Fossils

    NASA Astrophysics Data System (ADS)

    Schopf, J.

    2003-12-01

    Investigations of the Precambrian (~540- to ~3,500-Ma-old) fossil record depend critically on identification of authentic microbial fossils. Combined with standard paleontologic studies (e.g., of paleoecologic setting, population structure, cellular morphology, preservational variants), two techniques recently introduced to such studies -- Raman imagery and atomic force microscopy -- can help meet this need. Laser-Raman imagery is a non-intrusive, non-destructive technique that can be used to demonstrate a micron-scale one-to-one correlation between optically discernable morphology and the organic (kerogenous) composition of individual microbial fossils(1,2), a prime indicator of biogencity. Such analyses can be used to characterize the molecular-structural makeup of organic-walled microscopic fossils both in acid-resistant residues and in petrographic thin sections, and whether the fossils analyzed are exposed at the upper surface of, or are embedded within (to depths >65 microns), the section studied. By providing means to map chemically, in three dimensions, whole fossils or parts of such fossils(3), Raman imagery can also show the presence of cell lumina, interior cellular cavities, another prime indicator of biogenicity. Atomic force microscopy (AFM) has been used to visualize the nanometer-scale structure of the kerogenous components of single Precambrian microscopic fossils(4). Capable of analyzing minute fragments of ancient organic matter exposed at the upper surface of thin sections (or of kerogen particles deposited on flat surfaces), such analyses hold promise not only for discriminating between biotic and abiotic micro-objects but for elucidation of the domain size -- and, thus, the degree of graphitization -- of the graphene subunits of the carbonaceous matter analyzed. These techniques -- both new to paleobiology -- can provide useful insight into the biogenicity and geochemical maturity of ancient organic matter. References: (1) Kudryavtsev, A.B. et

  1. Atomic Force Microscopic Analysis of the Effect of Lipid Composition on Liposome Membrane Rigidity.

    PubMed

    Takechi-Haraya, Yuki; Sakai-Kato, Kumiko; Abe, Yasuhiro; Kawanishi, Toru; Okuda, Haruhiro; Goda, Yukihiro

    2016-06-21

    Mechanical rigidity of the liposome membrane is often defined by the membrane bending modulus and is one of the determinants of liposome stability, but the quantitative experimental data are still limited to a few kinds of liposomes. Here, we used atomic force microscopy to investigate the membrane bending moduli of liposomes by immobilizing them on bovine serum albumin-coated glass in aqueous medium. The following lipids were used for liposome preparation: egg yolk phosphatidylcholine, dioleoylphosphatidylcholine, hydrogenated soybean phosphatidylcholine, dipalmitoylphosphatidylcholine, 1,2-dioleoyl-3-trimethylammonium-propane, cholesterol, and N-(carbonylmethoxypoly(ethylene glycol) 2000)-1,2-distearoyl-sn-glycero-3-phosphoethanolamine. By using liposomes of various compositions, we showed that the thermodynamic phase state of the membrane rather than the electric potential or liposome surface modification with poly(ethylene glycol) is the predominant determinant of the bending modulus, which decreased in the following order: solid ordered > liquid ordered > liquid disordered. By using the generalized polarization value of the Laurdan fluorescent probe, we investigated membrane rigidity in terms of membrane fluidity. Atomic force microscopic analysis was superior to the Laurdan method, especially in evaluating the membrane rigidity of liposomes containing hydrogenated soybean phosphatidylcholine and cholesterol. Positively charged liposomes with a large bending modulus were taken up by cells more efficiently than those with a small bending modulus. These findings offer a quantitative method of analyzing the membrane rigidity of nanosized liposomes with different lipid compositions and will contribute to the control of liposome stability and cellular uptake efficiency of liposomal formulations intended for clinical use. PMID:27232007

  2. A Weed Cantilever

    ERIC Educational Resources Information Center

    Keller, Elhannan L.; Padalino, John

    1977-01-01

    Describes the Environmental Action Task activity, which may be used as a recreational game or an environmental perception experience, may be conducted indoors or out-of-doors, using weed stems (or spaghetti) and masking tape to construct a cantilever. Small groups of children work together to make the cantilever with the longest arm. Further…

  3. Dissipative particle dynamics simulation of a liquid meniscus confined between atomic force microscope tip and substrate

    NASA Astrophysics Data System (ADS)

    Li, Zhen; Lan, Chuanjin; Ma, Yanbao

    2012-11-01

    Liquid meniscus forms between the atomic force microscope (AFM) tip and the substrate under ambient humidity. The liquid meniscus affects the AFM measurements and plays an important role in dip-pen nanolithography. To understand the behaviors of the meniscus, a mesoscopic methodology called dissipative particle dynamics (DPD) is utilized to investigate the liquid meniscus confined between AFM tip and a solid surface. Results show that the structure of the liquid meniscus is highly dependent on the wettability properties of the tip and the substrate as well as the tip-to-surface distance. The area of liquid-solid interface increases as the wetting properties of the tip and substrate change from hydrophilic to hydrophobic, which results in a transition of the meniscus shape from convex to concave. The wetting properties of solid surface affect the process of the liquid meniscus breakup as the tip-to-surface distance increase. This nonlinear process is also affected by the surface tension of the liquid, thermal fluctuation and the speed of tip.

  4. Fabrication and measurement of nanostructures on the micro ball surface using a modified atomic force microscope.

    PubMed

    Zhao, X S; Geng, Y Q; Li, W B; Yan, Y D; Hu, Z J; Sun, T; Liang, Y C; Dong, S

    2012-11-01

    In order to machine and measure nanostructures on the micro ball surface, a modified atomic force microscope (AFM) combining a commercial AFM system with a home built precision air bearing spindle is established. Based on this system, motions of both the AFM scanner and the air bearing spindle are controlled to machine nanostructures on the micro ball based on the AFM tip-based nano mechanical machining approach. The eccentric error between the axis of the micro ball and the axis of the spindle is reduced to 3-4 μm by the provided fine adjusting method. A 1000 nano lines array, 36 square pits structure, 10 square pits structure, and a zig-zag structure on the circumference of the micro ball with the diameter of 1.5 mm are machined successfully. The measurement results achieved by the same system reveal that the profiles and mode-power spectra curves of the micro ball are influenced by the artificially machined nanostructures significantly according to their distributions. This work is an useful attempt for modifying the micro ball profile and manufacture of the spherical modulation targets to study the experimental performance of the micro ball in implosion. PMID:23206095

  5. Microstructural properties of superalloys investigated by nanoindentations in an atomic force microscope

    SciTech Connect

    Goeken, M.; Kempf, M.

    1999-02-05

    The microstructure of nickel-base superalloys with differently shaped {gamma}{prime} precipitates determines their excellent high-temperature behavior. A reliable quantitative determination of volume fraction and particle size distribution (PSD) of these precipitates is difficult, since the size of the precipitates is often below 100 nm. With an atomic force microscope (AFM), sections through specimens are analyzed with a resolution in the nanometer range, which allows a quantitative determination of the {gamma}{prime} volume content and PSD for different superalloys. Thus, determined volume fractions for the {gamma}{prime} phase in the superalloys CMSX-6 and Waspaloy amount to 56% and 27%, respectively. A combination of an AFM with a nanoindentation system also allows the measurement of local mechanical properties such as hardness and elasticity. These quantities are determined for the first time directly on the superalloys CMSX-6 and Waspaloy for the {gamma}{prime} and matrix phases, separately. The {gamma}{prime} phase in both alloys shows a significantly higher but different hardness than the matrix phase, whereas the moduli of elasticity are similar. A depth dependence of the hardness was found for very small indentations.

  6. Cometary dust at the smallest scale - latest results of the MIDAS Atomic Force Microscope onboard Rosetta

    NASA Astrophysics Data System (ADS)

    Bentley, Mark; Torkar, Klaus; Jeszenszky, Harald; Romstedt, Jens; Schmied, Roland; Mannel, Thurid

    2015-04-01

    The MIDAS instrument onboard the Rosetta orbit is a unique combination of a dust collection and handling system and a high resolution Atomic Force Microscope (AFM). By building three-dimensional images of the dust particle topography, MIDAS addresses a range of fundamental questions in Solar System and cometary science. The first few months of dust collection and scanning revealed a deficit of smaller (micron and below) particles but eventually several 10 µm-class grains were discovered. In fact these were unexpectedly large and close to the limit of what is observable with MIDAS. As a result the sharp tip used by the AFM struck the particles from the side, causing particle breakage and distortion. Analyses so far suggest that the collected particles are fluffy aggregates of smaller sub-units, although determination of the size of these sub-units and high resolution re-imaging remains to be done. The latest findings will be presented here, including a description of the particles collected and the implications of these observations for cometary science and the Rosetta mission at comet 67P.

  7. Domain wall displacements in amorphous films and multilayers studied with a magnetic force microscope

    NASA Astrophysics Data System (ADS)

    Pokhil, Taras G.

    1997-04-01

    The magnetic force microscope (MFM) was used to study the displacement of domain walls (DW) in amorphous TbFe alloy films and Co/Pd multilayer films with high spatial resolution. The reversible bending of domain wall segments pinned to defects and irreversible, jumplike displacement of domain wall segments were imaged with the MFM in an applied magnetic field. The maximum reversible displacement of domain walls was 50-100 nm and the length of the segments which reversibly curved in the field was about 150 nm. Measurement of the change in radius of curvature of a DW segment in response to an applied field allowed estimation of the DW energy density and self-demagnetizing field of the film acting on the DW. The DW energy density for the TbFe films was about 1 erg/cm2. It was shown that the self-demagnetizing field acting on a domain wall depends on the domain structure surrounding the studied DW segment. For instance, for a film with saturation magnetization 100 G and thickness 80 nm, which exhibited a mazelike domain structure, the demagnetizing field varied from 100 G in the center of a mazelike domain to 400 G near the edge of a domain. The irreversible displacement of a DW was not a continuous process. The 200-400 nm long DW segments exhibited jumplike motion over distances of 100-150 nm.

  8. Fast, multi-frequency, and quantitative nanomechanical mapping of live cells using the atomic force microscope.

    PubMed

    Cartagena-Rivera, Alexander X; Wang, Wen-Horng; Geahlen, Robert L; Raman, Arvind

    2015-01-01

    A longstanding goal in cellular mechanobiology has been to link dynamic biomolecular processes underpinning disease or morphogenesis to spatio-temporal changes in nanoscale mechanical properties such as viscoelasticity, surface tension, and adhesion. This requires the development of quantitative mechanical microscopy methods with high spatio-temporal resolution within a single cell. The Atomic Force Microscope (AFM) can map the heterogeneous mechanical properties of cells with high spatial resolution, however, the image acquisition time is 1-2 orders of magnitude longer than that required to study dynamic cellular processes. We present a technique that allows commercial AFM systems to map quantitatively the dynamically changing viscoelastic properties of live eukaryotic cells at widely separated frequencies over large areas (several 10's of microns) with spatial resolution equal to amplitude-modulation (AM-AFM) and with image acquisition times (tens of seconds) approaching those of speckle fluorescence methods. This represents a ~20 fold improvement in nanomechanical imaging throughput compared to AM-AFM and is fully compatible with emerging high speed AFM systems. This method is used to study the spatio-temporal mechanical response of MDA-MB-231 breast carcinoma cells to the inhibition of Syk protein tyrosine kinase giving insight into the signaling pathways by which Syk negatively regulates motility of highly invasive cancer cells. PMID:26118423

  9. Fast, multi-frequency, and quantitative nanomechanical mapping of live cells using the atomic force microscope

    PubMed Central

    Cartagena-Rivera, Alexander X.; Wang, Wen-Horng; Geahlen, Robert L.; Raman, Arvind

    2015-01-01

    A longstanding goal in cellular mechanobiology has been to link dynamic biomolecular processes underpinning disease or morphogenesis to spatio-temporal changes in nanoscale mechanical properties such as viscoelasticity, surface tension, and adhesion. This requires the development of quantitative mechanical microscopy methods with high spatio-temporal resolution within a single cell. The Atomic Force Microscope (AFM) can map the heterogeneous mechanical properties of cells with high spatial resolution, however, the image acquisition time is 1–2 orders of magnitude longer than that required to study dynamic cellular processes. We present a technique that allows commercial AFM systems to map quantitatively the dynamically changing viscoelastic properties of live eukaryotic cells at widely separated frequencies over large areas (several 10’s of microns) with spatial resolution equal to amplitude-modulation (AM-AFM) and with image acquisition times (tens of seconds) approaching those of speckle fluorescence methods. This represents a ~20 fold improvement in nanomechanical imaging throughput compared to AM-AFM and is fully compatible with emerging high speed AFM systems. This method is used to study the spatio-temporal mechanical response of MDA-MB-231 breast carcinoma cells to the inhibition of Syk protein tyrosine kinase giving insight into the signaling pathways by which Syk negatively regulates motility of highly invasive cancer cells. PMID:26118423

  10. Nanoimaging and ultra structure of Entamoeba histolytica and its pseudopods by using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Joshi, Narahari V.; Medina, Honorio; Urdaneta, H.; Barboza, J.

    2000-04-01

    Nan-imaging of Entamoeba histolytica was carried out by using Atomic Force Microscope (AFM). The structure of the nucleus, endoplasm and ectoplasm were studied separately. The diameter of the nucleus in living E. histolytica was found to be of the order of 10 micrometers which is slightly higher than the earlier reported value. The presence of karysome was detected in the nucleus. Well-organized patterns of chromatoid bodies located within the endoplasm, were detected and their repetitive patterns were examined. The organized structure was also extended within the ectoplasm. The dimensions and form of the organization suggest that chromatic bodies are constituted with ribosomes ordered in the form of folded sheet. Such structures were found to be absent in non-living E. histolytica. AFM images were also captured just in the act when ameba was extending its pseudopods. Alteration in the ultrastructure caused during the process of extension was viewed. Well marked canals of width 694.05 nm. And height 211.05 nm are clearly perceptible towards the direction of the pseudopods. 3D images are presented to appreciate the height variation, which can not be achieved by conventional well-established techniques such as electron microscopy.

  11. Fast, multi-frequency, and quantitative nanomechanical mapping of live cells using the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Cartagena-Rivera, Alexander X.; Wang, Wen-Horng; Geahlen, Robert L.; Raman, Arvind

    2015-06-01

    A longstanding goal in cellular mechanobiology has been to link dynamic biomolecular processes underpinning disease or morphogenesis to spatio-temporal changes in nanoscale mechanical properties such as viscoelasticity, surface tension, and adhesion. This requires the development of quantitative mechanical microscopy methods with high spatio-temporal resolution within a single cell. The Atomic Force Microscope (AFM) can map the heterogeneous mechanical properties of cells with high spatial resolution, however, the image acquisition time is 1-2 orders of magnitude longer than that required to study dynamic cellular processes. We present a technique that allows commercial AFM systems to map quantitatively the dynamically changing viscoelastic properties of live eukaryotic cells at widely separated frequencies over large areas (several 10’s of microns) with spatial resolution equal to amplitude-modulation (AM-AFM) and with image acquisition times (tens of seconds) approaching those of speckle fluorescence methods. This represents a ~20 fold improvement in nanomechanical imaging throughput compared to AM-AFM and is fully compatible with emerging high speed AFM systems. This method is used to study the spatio-temporal mechanical response of MDA-MB-231 breast carcinoma cells to the inhibition of Syk protein tyrosine kinase giving insight into the signaling pathways by which Syk negatively regulates motility of highly invasive cancer cells.

  12. Evidence for microscopic, long-range hydration forces for a hydrophobic amino acid

    PubMed Central

    Pertsemlidis, Alexander; Soper, Alan K.; Sorenson, Jon M.; Head-Gordon, Teresa

    1999-01-01

    We have combined neutron solution scattering experiments with molecular dynamics simulation to isolate an excess experimental signal that is caused solely by N-acetyl-leucine-amide (NALA) correlations in aqueous solution. This excess signal contains information about how NALA molecule centers are correlated in water, and we show how these solute–solute correlations might be determined at dilute concentrations in the small angle region. We have tested qualitatively different pair distribution functions for NALA molecule centers—gas, cluster, and aqueous forms of gc(r)—and have found that the excess experimental signal is adequate enough to rule out gas and cluster pair distribution functions. The aqueous form of gc(r) that exhibits a solvent-separated minimum, and possibly longer-ranged correlations as well, is not only physically sound but reproduces the experimental data reasonably well. This work demonstrates that important information in the small angle region can be mined to resolve solute–solute correlations, their lengthscales, and thermodynamic consequences even at dilute concentrations. The hydration forces that operate on the microscopic scale of individual amino acid side chains, implied by the small angle scattering data, could have significant effects on the early stages of protein folding, on ligand binding, and on other intermolecular interactions. PMID:9892659

  13. Charge Transport of Self-assembled DNA Networks measured by Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Lee, Hea-Yeon; Tanaka, Hidekazu; Kawai, Tomoji

    2001-03-01

    DNA is important not only a source of biological information but also an important scaffold for nanostructure. Recently, electrical transport measurements on micrometer-long DNA ropes in film or networks have indicated that DNA behaves as a good linear conductor. A structure containing a single type of base pair appears to be a good candidate for one-dimensional energy transfer and conduction along the Ĉ-electron cloudes of stacked bases. Especially, it is found that the poly (dG)-poly (dC) DNA has the best conductivity and can act as a conducting nanowire. Here we will describe measurement of the electrical transport characteristic through double-stranded poly (dG)-poly (dC) DNA molecules using a conducting probe atomic force microscope (CP-AFM). Self-assembled poly (dG)-poly (dC) networks performing the uniform two-dimensional reticulate structure _1) show the rectification character by current-voltage (I-V) curve. Charge transport structure will be present by an asymmetric bands diagram. The research has significant implication for the application of DNA in electronic devices and DNA-based electrochemical biosensors. --- _1) T. Kanno, H. Tanaka, N. Miyoshi, T. Kawai, Jpn. J Appl. Phys., 39 (2000) L269 : L. Cai, H. Tabata, T. Kawai Appl. Phys. Lett., 77 (2000) 3105

  14. Study of the Conformational Changes of Chlorophyll a (Chl a) Colloids with the Atomic Force Microscope.

    PubMed

    Boussaad; Tazi; Leblanc

    1999-01-15

    Atomic force microscopic (AFM) images of chlorophyll a (Chl a) colloids deposited onto mica and Au(111) present two different shapes. The colloids appear as clouds on mica and as large chains on Au(111). This difference in topography is attributed to different interactions between the colloids and the substrate. The real-time changes occurring during the electrodeposition of the colloids are also monitored. For an applied electric field intensity varying between 5 x 10(3) and 25 x 10(4) V/m, the colloids are opened and flattened relative to a deposition in the absence of an electric field and the drop method. However, when these films are exposed to ethanol vapors, disaggregation occurrs. These changes indicate that the association of Chl a dimers can form nanocrystals with large size distribution: 45-100 nm. Arrangement of nanocrystals in colloids is a characteristic feature of microcrystalline Chl a. The interaction between the colloids and H2O can also provoke aggregate dissociation. Copyright 1999 Academic Press. PMID:9885260

  15. Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

    SciTech Connect

    Jin, Hua; Xing, Xiaobo; Zhao, Hongxia; Chen, Yong; Huang, Xun; Ma, Shuyuan; Ye, Hongyan; Cai, Jiye

    2010-01-22

    The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

  16. Self-heating in piezoresistive cantilevers

    PubMed Central

    Doll, Joseph C.; Corbin, Elise A.; King, William P.; Pruitt, Beth L.

    2011-01-01

    We report experiments and models of self-heating in piezoresistive microcantilevers that show how cantilever measurement resolution depends on the thermal properties of the surrounding fluid. The predicted cantilever temperature rise from a finite difference model is compared with detailed temperature measurements on fabricated devices. Increasing the fluid thermal conductivity allows for lower temperature operation for a given power dissipation, leading to lower force and displacement noise. The force noise in air is 76% greater than in water for the same increase in piezoresistor temperature. PMID:21731884

  17. Cleaning of Dust between Interactive Contact Surfaces by Application of Normal Loads of Artificial Stainless-Cantilever in AFM

    NASA Astrophysics Data System (ADS)

    Choi, Seungchol; Horie, Mikio; Ando, Yasuhisa

    In this study, we investigated that interactive contact surfaces were affected by dust and applied normal loads of cantilever such as bristles. In order to study the effect of interactive contact surfaces, spherical particles (dry borosilicate glass sphere, plastic sphere) with curvature radius (R=5 μm, R=10 μm) were glued to artificial stainless cantilevers (spring constant k=576.7 N/m). The experiments were performed on various normal applied loads using an AFM (Atomic force microscope). The results indicate that spheres with a small curvature radius removed dust more effectively than did either of those with a large curvature radius, abraded by using the stainless cantilever, over the wide contact area (50 μmx50 μm). The plastic spheres tend to deform more than do the borosilicate glass spheres under the same applied load and the spheres with a smaller curvature radius tend to deform than do those with a larger curvature radius and the same material properties. Therefore, it had an influence on interactive surface forces. Restructuring dust aggregates by sliding a cantilever, as well as applying loads and contact pressure, forms a new micro contact area, which influences micro surface forces.

  18. Rapid detection of bacterial resistance to antibiotics using AFM cantilevers as nanomechanical sensors

    NASA Astrophysics Data System (ADS)

    Longo, G.; Alonso-Sarduy, L.; Rio, L. Marques; Bizzini, A.; Trampuz, A.; Notz, J.; Dietler, G.; Kasas, S.

    2013-07-01

    The widespread misuse of drugs has increased the number of multiresistant bacteria, and this means that tools that can rapidly detect and characterize bacterial response to antibiotics are much needed in the management of infections. Various techniques, such as the resazurin-reduction assays, the mycobacterial growth indicator tube or polymerase chain reaction-based methods, have been used to investigate bacterial metabolism and its response to drugs. However, many are relatively expensive or unable to distinguish between living and dead bacteria. Here we show that the fluctuations of highly sensitive atomic force microscope cantilevers can be used to detect low concentrations of bacteria, characterize their metabolism and quantitatively screen (within minutes) their response to antibiotics. We applied this methodology to Escherichia coli and Staphylococcus aureus, showing that live bacteria produced larger cantilever fluctuations than bacteria exposed to antibiotics. Our preliminary experiments suggest that the fluctuation is associated with bacterial metabolism.

  19. Ink-on-probe hydrodynamics in atomic force microscope deposition of liquid inks.

    PubMed

    O'Connell, Cathal D; Higgins, Michael J; Sullivan, Ryan P; Moulton, Simon E; Wallace, Gordon G

    2014-09-24

    The controlled deposition of attolitre volumes of liquids may engender novel applications such as soft, nano-tailored cell-material interfaces, multi-plexed nano-arrays for high throughput screening of biomolecular interactions, and localized delivery of reagents to reactions confined at the nano-scale. Although the deposition of small organic molecules from an AFM tip, known as dip-pen nanolithography (DPN), is being continually refined, AFM deposition of liquid inks is not well understood, and is often fraught with inconsistent deposition rates. In this work, the variation in feature-size over long term printing experiments for four model inks of varying viscosity is examined. A hierarchy of recurring phenomena is uncovered and there are attributed to ink movement and reorganisation along the cantilever itself. Simple analytical approaches to model these effects, as well as a method to gauge the degree of ink loading using the cantilever resonance frequency, are described. In light of the conclusions, the various parameters which need to be controlled in order to achieve uniform printing are dicussed. This work has implications for the nanopatterning of viscous liquids and hydrogels, encompassing ink development, the design of probes and printing protocols. PMID:24861023

  20. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Das, Soma; Sreeram, P. A.; Raychaudhuri, A. K.

    2007-01-01

    We find that the 'jump-into-contact' of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a nonlinear force field. We show that the 'jump-into-contact' distance can be used to find the interaction of the cantilever tip with the surface. In the specific context of the attractive van der Waals interaction, this method can be realized as a new method of measuring the Hamaker constant for materials. The Hamaker constant is determined from the deflection of the cantilever at the 'jump-into-contact' using the force constant of the cantilever and the tip radius of curvature, all of which can be obtained by measurements. The results have been verified experimentally on a sample of cleaved mica, a sample of Si wafer with natural oxide and a silver film, using a number of cantilevers with different spring constants. We emphasize that the method described here is applicable only to surfaces that have van der Waals interaction as the tip-sample interaction. We also find that the tip to sample separation at the 'jump-into-contact' is simply related to the cantilever deflection at this point, and this provides a method to exactly locate the surface.

  1. Fabrication of large scale nanostructures based on a modified atomic force microscope nanomechanical machining system.

    PubMed

    Hu, Z J; Yan, Y D; Zhao, X S; Gao, D W; Wei, Y Y; Wang, J H

    2011-12-01

    The atomic force microscope (AFM) tip-based nanomechanical machining has been demonstrated to be a powerful tool for fabricating complex 2D∕3D nanostructures. But the machining scale is very small, which holds back this technique severely. How to enlarge the machining scale is always a major concern for the researches. In the present study, a modified AFM tip-based nanomechanical machining system is established through combination of a high precision X-Y stage with the moving range of 100 mm × 100 mm and a commercial AFM in order to enlarge the machining scale. It is found that the tracing property of the AFM system is feasible for large scale machining by controlling the constant normal load. Effects of the machining parameters including the machining direction and the tip geometry on the uniform machined depth with a large scale are evaluated. Consequently, a new tip trace and an increasing load scheme are presented to achieve a uniform machined depth. Finally, a polymer nanoline array with the dimensions of 1 mm × 0.7 mm, the line density of 1000 lines/mm and the average machined depth of 150 nm, and a 20 × 20 polymer square holes array with the scale of 380 μm × 380 μm and the average machined depth of 250 nm are machined successfully. The uniform of the machined depths for all the nanostructures is acceptable. Therefore, it is verified that the AFM tip-based nanomechanical machining method can be used to machine millimeter scale nanostructures. PMID:22225244

  2. X-ray holographic microscopy using the atomic-force microscope

    SciTech Connect

    Howells, M.R.; Jacobsen, C.J.; Lindaas, S.

    1993-09-01

    The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach.

  3. The emergence of multifrequency force microscopy.

    PubMed

    Garcia, Ricardo; Herruzo, Elena T

    2012-04-01

    In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the surface of a sample, and information about the surface is extracted by measuring how the deflection of the cantilever - which is caused by interactions between the tip and the surface - varies with position. In the most common form of atomic force microscopy, dynamic force microscopy, the cantilever is made to vibrate at a specific frequency, and the deflection of the tip is measured at this frequency. But the motion of the cantilever is highly nonlinear, and in conventional dynamic force microscopy, information about the sample that is encoded in the deflection at frequencies other than the excitation frequency is irreversibly lost. Multifrequency force microscopy involves the excitation and/or detection of the deflection at two or more frequencies, and it has the potential to overcome limitations in the spatial resolution and acquisition times of conventional force microscopes. Here we review the development of five different modes of multifrequency force microscopy and examine its application in studies of proteins, the imaging of vibrating nanostructures, measurements of ion diffusion and subsurface imaging in cells. PMID:22466857

  4. Three-dimensional force microscope: A nanometric optical tracking and magnetic manipulation system for the biomedical sciences

    NASA Astrophysics Data System (ADS)

    Fisher, J. K.; Cummings, J. R.; Desai, K. V.; Vicci, L.; Wilde, B.; Keller, K.; Weigle, C.; Bishop, G.; Taylor, R. M.; Davis, C. W.; Boucher, R. C.; O'Brien, E. Timothy; Superfine, R.

    2005-05-01

    We report here the development of a three-dimensional (3D) magnetic force microscope for applying forces to and measuring responses of biological systems and materials. This instrument combines a conventional optical microscope with a free-floating or specifically bound magnetic bead used as a mechanical probe. Forces can be applied by the bead to microscopic structures of interest (specimens), while the reaction displacement of the bead is measured. This enables 3D mechanical manipulations and measurements to be performed on specimens in fluids. Force is generated by the magnetically permeable bead in reaction to fields produced by external electromagnets. The displacement is measured by interferometry using forward light scattered by the bead from a focused laser beam. The far-field interference pattern is imaged on a quadrant photodetector from which the 3D displacement can be computed over a limited range about the focal point. The bead and specimen are mounted on a 3D translation stage and feedback techniques are used to keep the bead within this limited range. We demonstrate the system with application to beads attached to cilia in human lung cell cultures.

  5. Automated parallel high-speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Minne, S. C.; Yaralioglu, G.; Manalis, S. R.; Adams, J. D.; Zesch, J.; Atalar, A.; Quate, C. F.

    1998-05-01

    An expandable system has been developed to operate multiple probes for the atomic force microscope in parallel at high speeds. The combined improvements from parallelism and enhanced tip speed in this system represent an increase in throughput by over two orders of magnitude. A modular cantilever design has been replicated to produce an array of 50 cantilevers with a 200 μm pitch. This design contains a dedicated integrated sensor and integrated actuator where the cells can be repeated indefinitely. Electrical shielding within the array virtually eliminates coupling between the actuators and sensors. The reduced coupling simplifies the control electronics, facilitating the design of a computer system to automate the parallel high-speed arrays. This automated system has been applied to four cantilevers within the array of 50 cantilevers, with a 20 kHz bandwidth and a noise level of less than 50 Å. For typical samples, this bandwidth allows us to scan the probes at 4 mm/s.

  6. Asymptotic analysis of a vibrating cantilever with a nonlinear boundary

    NASA Astrophysics Data System (ADS)

    Chen, Liqun; Lim, C. W.; Hu, Qingquan; Ding, Hu

    2009-09-01

    Nonlinear vibration of a cantilever in a contact atomic force microscope is analyzed via an asymptotic approach. The asymptotic solution is sought for a beam equation with a nonlinear boundary condition. The steady-state responses are determined in primary resonance and subharmonic resonance. The relations between the response amplitudes and the excitation frequencies and amplitudes are derived from the solvability condition. Multivaluedness occurs in the relations as a consequence of the nonlinearity. The stability of steady-state responses is analyzed by use of the Lyapunov linearized stability theory. The stability analysis predicts the jumping phenomenon for certain parameters. The curves of the response amplitudes changing with the excitation frequencies are numerically compared with those obtained via the method of multiple scales. The calculation results demonstrate that the two methods predict the same varying tendencies while there are small quantitative differences.

  7. Concept and Demonstration of Individual Probe Actuation in Two-Dimensional Parallel Atomic Force Microscope System

    NASA Astrophysics Data System (ADS)

    Akiyama, Terunobu; Aeschimann, Laure; Chantada, Laura; de Rooij, Nico. F.; Heinzelmann, Harry; Herzig, Hans P.; Manzardo, Omar; Meister, André; Polesel-Maris, Jérôme; Pugin, Raphaël; Staufer, Urs; Vettiger, Peter

    2007-09-01

    A concept of an array actuator that is used to control the tip-sample separation of cantilevers in a two-dimensional (2D) probe array scanning system is proposed in this article. The feasibility of the concept is demonstrated with a 10× 10 array actuator with 500 μm xy-pitches. The array actuator is made by slicing a bulk piezoceramic block. The obtained maximum actuation of a single probe was 2.19 μmp-p at ± 168 Vp-p. A major issue for the actuator was the insufficient strength of the frame of the probe array chip. The demonstrated array actuator is highly compatible with previously developed parallel readout modules that use either a parallel optical beam or integrated piezoresistive deflection sensing. A large-scale 2D probe array is our ultimate target.

  8. Fermi-level shifts in graphene transistors with dual-cut channels scraped by atomic force microscope tips

    SciTech Connect

    Lin, Meng-Yu; Chen, Yen-Hao; Su, Chen-Fung; Chang, Shu-Wei; Lee, Si-Chen; Lin, Shih-Yen

    2014-01-13

    We investigate the electronic properties of p-type graphene transistors on silicon dioxide with dual-cut channels that were scraped using atomic force microscope tips. In these devices, the current is forced to squeeze into the path between the two cuts rather than flow directly through the graphene sheet. We observe that the gate voltages with minimum current shift toward zero bias as the sizes of the dual-cut regions increase. These phenomena suggest that the Fermi levels in the dual-cut regions are shifted toward the Dirac points after the mechanical scraping process.

  9. Assessment of insulated conductive cantilevers for biology and electrochemistry

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Gullo, Maurizio R.; Akiyama, Terunobu; Tonin, Andreas; de Rooij, Nicolaas F.; Staufer, Urs; Engel, Andreas

    2005-08-01

    This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <=0.1 N m-1 and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than 1 pA in faradaic current with a lateral resolution of 7.8 nm.

  10. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.

    PubMed

    Lange, Manfred; van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip-sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force-distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle. PMID:22496993

  11. Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging.

    PubMed

    Soltani Bozchalooi, I; Careaga Houck, A; AlGhamdi, J; Youcef-Toumi, K

    2016-01-01

    This paper presents the design and control of a high-speed and large-range atomic force microscopy (AFM). A multi-actuation scheme is proposed where several nano-positioners cooperate to achieve the range and speed requirements. A simple data-based control design methodology is presented to effectively operate the AFM scanner components. The proposed controllers compensate for the coupled dynamics and divide the positioning responsibilities between the scanner components. As a result, the multi-actuated scanner behavior is equivalent to that of a single X-Y-Z positioner with large range and high speed. The scanner of the designed AFM is composed of five nano-positioners, features 6 μm out-of-plane and 120 μm lateral ranges and is capable of high-speed operation. The presented AFM has a modular design with laser spot size of 3.5 μm suitable for small cantilever, an optical view of the sample and probe, a conveniently large waterproof sample stage and a 20 MHz data throughput for high resolution image acquisition at high imaging speeds. This AFM is used to visualize etching of calcite in a solution of sulfuric acid. Layer-by-layer dissolution and pit formation along the crystalline lines in a low pH environment is observed in real time. PMID:26547505

  12. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    PubMed Central

    van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Summary Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force–distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle. PMID:22496993

  13. Biomechanical load analysis of cantilevered implant systems.

    PubMed

    Osier, J F

    1991-01-01

    Historically, dental implants have been placed in areas where quality bone exists. The maxillary sinus areas and mandibular canal proximities have been avoided. From these placements, various cantilevered prosthetic applications have emerged. This analysis uses static engineering principles to define the loads (i.e., forces) placed upon the implants. These principles make use of Newton's first and third laws of mechanics by summing the forces and moments to zero. These summations then generate mathematical equations and their algebraic solutions. Three implant systems are analyzed. The first is a two-implant system. The second is a three-implant cross-arch stabilized system usually found in mandibular replacements of lower full dentures. The third is a five-implant system which is identical to the three-implant cantilevered system but which uses implants in the first molar area, thereby negating the cantilevered load magnification of the three-implant design. These analyses demonstrate that, in a cantilevered application, the implant closest to the point of load application (usually the most posterior implant) takes the largest compressive load. Implants opposite the load application (generally the anterior implant) are in tension. These loads on the implants are normally magnified over the biting force and can easily reach 2 1/2 to five times the biting load. PMID:1942131

  14. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

    PubMed Central

    Glatzel, Thilo; Schmölzer, Thomas; Schöner, Adolf; Reshanov, Sergey; Bartolf, Holger; Meyer, Ernst

    2015-01-01

    Summary Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the characterization of conducting or semiconducting power devices with EFM methods requires an accurate and reliable technique from the nanometre up to the micrometre scale. For high force sensitivity it is indispensable to operate the microscope under high to ultra-high vacuum (UHV) conditions to suppress viscous damping of the sensor. Furthermore, UHV environment allows for the analysis of clean surfaces under controlled environmental conditions. Because of these requirements we built a large area scanning probe microscope operating under UHV conditions at room temperature allowing to perform various electrical measurements, such as Kelvin probe force microscopy, scanning capacitance force microscopy, scanning spreading resistance microscopy, and also electrostatic force microscopy at higher harmonics. The instrument incorporates beside a standard beam deflection detection system a closed loop scanner with a scan range of 100 μm in lateral and 25 μm in vertical direction as well as an additional fibre optics. This enables the illumination of the tip–sample interface for optically excited measurements such as local surface photo voltage detection. Results: We present Kelvin probe force microscopy (KPFM) measurements before and after sputtering of a copper alloy with chromium grains used as electrical contact surface in ultra-high power switches. In addition, we discuss KPFM measurements on cross sections of cleaved silicon carbide structures: a calibration layer sample and a power rectifier. To demonstrate the benefit of surface photo voltage measurements, we analysed the contact potential difference of a silicon carbide p/n-junction under illumination. PMID:26885461

  15. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  16. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST BANK SIDE LOOKING NORTHWEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  17. Serial weighting of micro-objects with resonant microchanneled cantilevers.

    PubMed

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-14

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples. PMID:27608651

  18. Surface roughtness and its influence on particle adhesion using atomic force microscope techniques

    SciTech Connect

    Gady, B.; Schaefer, D.; Reifenberger, R.; Rimai, D.; DeMejo, L.P.

    1996-12-31

    The surface force interactions between individual 8 {mu}m diameter spheres and atomically flat substrates have been systematically investigated using atomic force techniques. The lift-off force of glass, polystyrene and tin particles from atomically smooth mica and highly oriented pyrolytic graphite substrates was determined as a function of the applied loading force in an inert nitrogen environment. While the relative magnitudes of the measured lift-off force was found to scale as expected between the various systems studied, the absolute values were a factor of {approximately}50 smaller than expected from the Johnson, Kendall, and Roberts theory. The surface topography of representative spheres was characterized with atomic force microscopy, allowing a quantitative assessment of the role that surface roughness plays in the adhesion of micrometer-size particles to substrates. Taking into account the radius of curvature of the asperities measured from the atomic force scans, agreement between the measured and theoretical estimates for the lift-off forces was improved, with the corrected experimental forces about a factor of 3 smaller than theoretical expectations.

  19. Dissipation and oscillatory solvation forces in confined liquids studied by small-amplitude atomic force spectroscopy.

    PubMed

    de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2010-08-13

    We determine conservative and dissipative tip-sample interaction forces from the amplitude and phase response of acoustically driven atomic force microscope (AFM) cantilevers using a non-polar model fluid (octamethylcyclotetrasiloxane, which displays strong molecular layering) and atomically flat surfaces of highly ordered pyrolytic graphite. Taking into account the base motion and the frequency-dependent added mass and hydrodynamic damping on the AFM cantilever, we develop a reliable force inversion procedure that allows for extracting tip-sample interaction forces for a wide range of drive frequencies. We systematically eliminate the effect of finite drive amplitudes. Dissipative tip-sample forces are consistent with the bulk viscosity down to a thickness of 2-3 nm. Dissipation measurements far below resonance, which we argue to be the most reliable, indicate the presence of peaks in the damping, corresponding to an enhanced 'effective' viscosity, upon expelling the last and second-last molecular layer. PMID:20639584

  20. Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical properties.

    PubMed

    Bercu, N B; Troyon, M; Molinari, M

    2016-09-01

    An original scanning near-field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM-based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near-field cathodoluminescence and topographic images of the sample. Share-force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques. PMID:27125561

  1. System analysis of force feedback microscopy

    NASA Astrophysics Data System (ADS)

    Rodrigues, Mario S.; Costa, Luca; Chevrier, Joël; Comin, Fabio

    2014-02-01

    It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

  2. System analysis of force feedback microscopy

    SciTech Connect

    Rodrigues, Mario S.; Chevrier, Joël; Comin, Fabio

    2014-02-07

    It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

  3. Measuring the cantilever-position-sensitive detector distance and cantilever curvature for cantilever sensor applications.

    PubMed

    Xu, Meng; Tian, Ye; Coates, M L; Beaulieu, L Y

    2009-09-01

    Measuring cantilever sensor deflections using an optical beam deflection system is more complicated than often assumed. The direction of the reflected beam is dependent on the surface normal of the cantilever, which in turn is dependent on the state of the cantilever. It is often assumed that the cantilever is both straight and perfectly level before the onset of sensing experiments although this assumption, especially the former, is rarely true. Failure to characterize the initial state of the cantilever can lead to irreproducibility in cantilever sensor measurements. We have developed three new methods for characterizing the initial state of the cantilever. In the first case we show how to define the initial angle of inclination beta of the chip on which the cantilever is attached. This method was tested using an aluminum block with a known angle of inclination. A new method for determining the initial distance L(o) between the cantilever and the position-sensitive detector (PSD) is also presented. This parameter which behaves as an amplification factor of the PSD signal is critical for obtaining precise cantilever sensor data. Lastly, we present a method for determining the initial curvature of the cantilever which often results from depositing the sensing platform on the lever. Experiments conducted using deflected cantilevers showed the model to be accurate. The characterization methods presented in this work are simple to use, easy to implement, and can be incorporated into most cantilever sensor setups. PMID:19791971

  4. Fiber-optic, cantilever-type acoustic motion velocity hydrophone.

    PubMed

    Cranch, G A; Miller, G A; Kirkendall, C K

    2012-07-01

    The interaction between fluid loaded fiber-optic cantilevers and a low frequency acoustic wave is investigated as the basis for an acoustic vector sensor. The displacements of the prototype cantilevers are measured with an integrated fiber laser strain sensor. A theoretical model predicting the frequency dependent shape of acoustically driven planar and cylindrical fiber-optic cantilevers incorporating effects of fluid viscosity is presented. The model demonstrates good agreement with the measured response of two prototype cantilevers, characterized with a vibrating water column, in the regime of Re ≥ 1. The performance of each cantilever geometry is also analyzed. Factors affecting the sensor performance such as fluid viscosity, laser mode profile, and support motion are considered. The planar cantilever is shown to experience the largest acoustically induced force and hence the highest acoustic responsivity. However, the cylindrical cantilever exhibits the smoothest response in water, due to the influence of viscous fluid damping, and is capable of two axis particle velocity measurement. These cantilevers are shown to be capable of achieving acoustic resolutions approaching the lowest sea-state ocean noise. PMID:22779459

  5. Monitoring the osmotic response of single yeast cells through force measurement in the environmental scanning electron microscope

    NASA Astrophysics Data System (ADS)

    Jansson, Anna; Nafari, Alexandra; Hedfalk, Kristina; Olsson, Eva; Svensson, Krister; Sanz-Velasco, Anke

    2014-02-01

    We present a measurement system that combines an environmental scanning electron microscope (ESEM) and an atomic force microscope (AFM). This combination enables studies of static and dynamic mechanical properties of hydrated specimens, such as individual living cells. The integrated AFM sensor provides direct and continuous force measurement based on piezoresistive force transduction, allowing the recording of events in the millisecond range. The in situ ESEM-AFM setup was used to study Pichia pastoris wild-type yeast cells. For the first time, a quantified measure of the osmotic response of an individual yeast cell inside an ESEM is presented. With this technique, cell size changes due to humidity variations can be monitored with nanometre accuracy. In addition, mechanical properties were extracted from load-displacement curves. A Young's modulus of 13-15 MPa was obtained for the P. pastoris yeast cells. The developed method is highly interesting as a complementary tool for the screening of drugs directed towards cellular water transport activity and provides new possibilities of studying mechanosensitive regulation of aquaporins.

  6. Resonant frequency and sensitivity of a caliper formed with assembled cantilever probes based on the modified strain gradient theory.

    PubMed

    Abbasi, Mohammad; Afkhami, Seyed E

    2014-12-01

    The resonant frequency and sensitivity of an atomic force microscope (AFM) with an assembled cantilever probe (ACP) is analyzed utilizing strain gradient theory, and then the governing equation and boundary conditions are derived by a combination of the basic equations of strain gradient theory and Hamilton's principle. The resonant frequency and sensitivity of the proposed AFM microcantilever are then obtained numerically. The proposed ACP includes a horizontal cantilever, two vertical extensions, and two tips located at the free ends of the extensions that form a caliper. As one of the extensions is located between the clamped and free ends of the AFM microcantilever, the cantilever is modeled as two beams. The results of the current model are compared with those evaluated by both modified couple stress and classical beam theories. The difference in results evaluated by the strain gradient theory and those predicted by the couple stress and classical beam theories is significant, especially when the microcantilever thickness is approximately the same as the material length-scale parameters. The results also indicate that at the low values of contact stiffness, scanning in the higher cantilever modes decrease the accuracy of the proposed AFM ACP. PMID:25205330

  7. Analysis of the effect of mechanical strength of the resist film on pattern collapse behavior using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Tamada, Osamu; Goto, Tomohiro; Sanada, Masakazu; Moriuchi, Takahiro; Niiyama, Takayoshi; Kawai, Akira

    2006-03-01

    Recently, pattern collapse is becoming one of the critical issues in semiconductor manufacturing and many works have been done to solve this issue1) 2). Since pattern collapse occurs when outer force onto the resist pattern such as surface tension, impact of rinse solution, etc. surpasses the resistance of the resist pattern such as mechanical strength, adhesion force between resist and substrate, it is considered effective for improvement of pattern collapse to control resist film properties by track process, i.e., optimization of the mechanical properties of the resist film and enhancement of the adhesion force between resist and substrate 3) -5). In this study, we focused on the mechanical strength of the resist film and examined how post applied bake (PAB) condition affects the pattern collapse behavior. From ellipsometry measurement, it was found that increasing PAB time and temperature resulted in thickness reduction and refractive index increase, which suggested that the density of the resist film became high. Then we analyzed the mechanical strength of the resist film with the tip indentation method using atomic force microscope. It was found that the hardness of the resist film was affected by PAB conditions and regardless of PAB condition, hardened layer existed beneath the film surface. Finally, we carried out the measurements of loads to collapse 180nm resist dot patterns using the direct peeling with atomic force microscope tip (DPAT) method. Loads ranged from 600 to 2000nN overall and essentially increased as seen for indentation measurements when PAB temperature or time was increased, except some critical conditions. Through these evaluations using AFM, we succeeded in quantitatively evaluate the mechanical properties of the resist films processed with various PAB conditions. It was found that PAB condition obviously impacts on the hardness of the resist film and it is closely related to pattern collapse load.

  8. Local triboelectrification of an n-GaAs surface using the tip of an atomic-force microscope

    SciTech Connect

    Brunkov, P. N. Goncharov, V. V.; Rudinsky, M. E.; Gutkin, A. A.; Gordeev, N. Yu.; Lantratov, V. M.; Kalyuzhnyy, N. A.; Mintairov, S. A.; Sokolov, R. V.; Konnikov, S. G.

    2013-09-15

    The method of scanning Kelvin-probe microscopy is used to show that the effect of triboelectrification is observed when the tip of an atomic-force microscope interacts with the surface of n-GaAs epitaxial layers. The sign of the change in the potential indicates that the sample surface after triboelectrification becomes more negative. The observed specific features of the phenomena can be attributed to the thermally activated generation of point defects in the vicinity of the sample surface due to deformation caused by the tip.

  9. Measuring Young's modulus of biological objects in a liquid medium using an atomic force microscope with a special probe

    NASA Astrophysics Data System (ADS)

    Lebedev, D. V.; Chuklanov, A. P.; Bukharaev, A. A.; Druzhinina, O. S.

    2009-04-01

    A special probe with a 5-μm-diameter ball fixed at the end is developed for an atomic force microscope (AFM), with the use of which it is possible to obtain more correct values of the Young’s moduli of biological objects in liquid media and eliminate the risk of damaging the sample surface. In particular, the AFM measurements with this probe in situ revealed an increase in the Young’s modulus of rat blood vessel under the action of chlorhexidine.

  10. Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization.

    PubMed

    Lanza, M; Bayerl, A; Gao, T; Porti, M; Nafria, M; Jing, G Y; Zhang, Y F; Liu, Z F; Duan, H L

    2013-03-13

    Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. PMID:23280635

  11. Label-Free Glucose Detection Using Cantilever Sensor Technology Based on Gravimetric Detection Principles

    PubMed Central

    Hsieh, Chiung-wen; Lin, Po-Chiao

    2013-01-01

    Efficient maintenance of glucose homeostasis is a major challenge in diabetes therapy, where accurate and reliable glucose level detection is required. Though several methods are currently used, these suffer from impaired response and often unpredictable drift, making them unsuitable for long-term therapeutic practice. In this study, we demonstrate a method that uses a functionalized atomic force microscope (AFM) cantilever as the sensor for reliable glucose detection with sufficient sensitivity and selectivity for clinical use. We first modified the AFM tip with aminopropylsilatrane (APS) and then adsorbed glucose-specific lectin concanavalin A (Con A) onto the surface. The Con A/APS-modified probes were then used to detect glucose by monitoring shifts in the cantilever resonance frequency. To confirm the molecule-specific interaction, AFM topographical images were acquired of identically treated silicon substrates which indicated a specific attachment for glucose-Con A and not for galactose-Con A. These results demonstrate that by monitoring the frequency shift of the AFM cantilever, this sensing system can detect the interaction between Con A and glucose, one of the biomolecule recognition processes, and may assist in the detection and mass quantification of glucose for clinical applications with very high sensitivity. PMID:23984191

  12. Titanium nanostructures made by local oxidation with the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Vullers, R. J. M.; Ahlskog, M.; Van Haesendonck, C.

    1999-04-01

    Surfaces can be oxidized under ambient conditions with the tip of a scanning probe microscope when applying a voltage between surface and tip. The oxidation process is voltage- and humidity-dependent, and can be explained in terms of anodic oxidation. Sufficiently thin metal films (e.g., Ti or Al) can be completely oxidized down to the substrate, enabling the direct writing of nanostructures. We report on the fabrication and electrical measurements of Ti lines and Ti/TiO x/Ti junctions defined in titanium thin films having a thickness smaller than 10 nm.

  13. Quantifying Hydrostatic Pressure in Plant Cells by Using Indentation with an Atomic Force Microscope

    PubMed Central

    Beauzamy, Léna; Derr, Julien; Boudaoud, Arezki

    2015-01-01

    Plant cell growth depends on a delicate balance between an inner drive—the hydrostatic pressure known as turgor—and an outer restraint—the polymeric wall that surrounds a cell. The classical technique to measure turgor in a single cell, the pressure probe, is intrusive and cannot be applied to small cells. In order to overcome these limitations, we developed a method that combines quantification of topography, nanoindentation force measurements, and an interpretation using a published mechanical model for the pointlike loading of thin elastic shells. We used atomic force microscopy to estimate the elastic properties of the cell wall and turgor pressure from a single force-depth curve. We applied this method to onion epidermal peels and quantified the response to changes in osmolality of the bathing solution. Overall our approach is accessible and enables a straightforward estimation of the hydrostatic pressure inside a walled cell. PMID:25992723

  14. Atomic force microscopic and theoretical studies of poly-ubiquitin proteins

    NASA Astrophysics Data System (ADS)

    Yeh, Y. L.; Chang, C. H.; Liang, K.-K.; Shiu, Y.-J.; Su, Charlene; Hayashi, M.; Chyan, C. L.; Yang, G.; Mo, Yan; Yan, YiJing; Lin, S. H.

    2004-12-01

    In this Letter, a theoretical model for the force-extension experiment applied to protein folding-unfolding is presented. This model explicitly takes into account the interplay between the mechanical energy and chemical energy. It can treat the effect of denaturing agents (like pH, GdnHCl, urea, etc.) and temperature on the force-extension experiment of protein folding-unfolding. We further apply the model to analyze our own force-extension experiment on ubiquitin tetramers and to the experimental data of other protein systems reported in literature. The current model can predict the quantities like the values of equilibrium constant, chemical potential and mole fraction of unfolded state involved in protein folding-unfolding and we have found that the proteins adsorbed on gold surfaces are partially unfolded in comparison with the bulk state.

  15. Quantifying hydrostatic pressure in plant cells by using indentation with an atomic force microscope.

    PubMed

    Beauzamy, Léna; Derr, Julien; Boudaoud, Arezki

    2015-05-19

    Plant cell growth depends on a delicate balance between an inner drive-the hydrostatic pressure known as turgor-and an outer restraint-the polymeric wall that surrounds a cell. The classical technique to measure turgor in a single cell, the pressure probe, is intrusive and cannot be applied to small cells. In order to overcome these limitations, we developed a method that combines quantification of topography, nanoindentation force measurements, and an interpretation using a published mechanical model for the pointlike loading of thin elastic shells. We used atomic force microscopy to estimate the elastic properties of the cell wall and turgor pressure from a single force-depth curve. We applied this method to onion epidermal peels and quantified the response to changes in osmolality of the bathing solution. Overall our approach is accessible and enables a straightforward estimation of the hydrostatic pressure inside a walled cell. PMID:25992723

  16. Prediction of atomic force microscope probe dynamics through the receptance coupling method

    SciTech Connect

    Mehrpouya, M.; Park, S. S.

    2011-12-15

    The increased growth in the use of tip-based sensing, manipulations, and fabrication of devices in atomic force microscopy (AFM) necessitates the accurate prediction of the dynamic behavior of the AFM probe. The chip holder, to which the micro-sensing device is attached, and the rest of the AFM system can affect the overall dynamics of the probe. In order to consider these boundary effects, we propose a novel receptance coupling method to mathematically combine the dynamics of the AFM setup and probe, based on the equilibrium and compatibility conditions at the joint. Once the frequency response functions of displacement over force at the tool tip are obtained, the dynamic interaction forces between the tip and the sample in nanoscale can be determined by measuring the probe tip displacement.

  17. Dynamic nanoimpedance characterization of the atomic force microscope tip-surface contact.

    PubMed

    Tobiszewski, Mateusz Tomasz; Zieliński, Artur; Darowicki, Kazimierz

    2014-02-01

    Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To enable comparison between materials and phases, a new standardization method is proposed, which simulates conditions of initial contact. PMID:24331246

  18. Atomic force microscopic investigation of respiratory syncytial virus infection in HEp-2 cells

    PubMed Central

    TIWARI, P. M.; EROGLU, E.; BOYOGLU-BARNUM, S.; HE, Q.; WILLING, G. A.; VIG, K.; DENNIS, V. A.; SINGH, S. R.

    2014-01-01

    Summary Respiratory syncytial virus (RSV) primarily causes bronchiolitis and pneumonia in infants. In spite of intense research, no safe and effective vaccine has been developed yet. For understanding its pathogenesis and development of anti-RSV drugs/therapeutics, it is indispensable to study the RSV–host interaction. Although, there are limited studies using electron microscopy to elucidate the infection process of RSV, to our knowledge, no study has reported the morphological impact of RSV infection using atomic force microscopy. We report the cytoplasmic and nuclear changes in human epidermoid cell line type 2 using atomic force microscopy. Human epidermoid cell line type 2 cells, grown on cover slips, were infected with RSV and fixed after various time periods, processed and observed for morphological changes using atomic force microscopy. RSV infected cells showed loss of membrane integrity, with degeneration in the cellular content and cytoskeleton. Nuclear membrane was disintegrated and nuclear volume was decreased. The chromatin of the RSV infected cells was condensed, progressing towards degeneration via pyknosis and apoptosis. Membrane protrusions of ~150–200 nm diameter were observed on RSV infected cells after 6 h, suggestive of prospective RSV budding sites. To our knowledge, this is the first study of RSV infection process using atomic force microscopy. Such morphological studies could help explore viral infection process aiding the development of anti-RSV therapies. PMID:24251370

  19. Calibration of higher eigenmodes of cantilevers

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

  20. Calibration of higher eigenmodes of cantilevers.

    PubMed

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem. PMID:27475563

  1. Force feedback microscopy based on an optical beam deflection scheme

    NASA Astrophysics Data System (ADS)

    Vitorino, Miguel V.; Carpentier, Simon; Costa, Luca; Rodrigues, Mario S.

    2014-07-01

    Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far used an optical cavity to measure the tip displacement. In this Letter, we show that the more conventional optical beam deflection scheme can be used to the same purpose. With this instrument, we have followed the evolution of the Brownian motion of the tip under the influence of a water bridge.

  2. Force feedback microscopy based on an optical beam deflection scheme

    SciTech Connect

    Vitorino, Miguel V.; Rodrigues, Mario S.; Carpentier, Simon; Costa, Luca

    2014-07-07

    Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far used an optical cavity to measure the tip displacement. In this Letter, we show that the more conventional optical beam deflection scheme can be used to the same purpose. With this instrument, we have followed the evolution of the Brownian motion of the tip under the influence of a water bridge.

  3. Harnessing the damping properties of materials for high-speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Adams, Jonathan D.; Erickson, Blake W.; Grossenbacher, Jonas; Brugger, Juergen; Nievergelt, Adrian; Fantner, Georg E.

    2016-02-01

    The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant.

  4. Harnessing the damping properties of materials for high-speed atomic force microscopy.

    PubMed

    Adams, Jonathan D; Erickson, Blake W; Grossenbacher, Jonas; Brugger, Juergen; Nievergelt, Adrian; Fantner, Georg E

    2016-02-01

    The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant. PMID:26595334

  5. The Intrinsic Resolution Limit in the Atomic Force Microscope: Implications for Heights of Nano-Scale Features

    PubMed Central

    Santos, Sergio; Barcons, Victor; Christenson, Hugo K.; Font, Josep; Thomson, Neil H.

    2011-01-01

    Background Accurate mechanical characterization by the atomic force microscope at the highest spatial resolution requires that topography is deconvoluted from indentation. The measured height of nanoscale features in the atomic force microscope (AFM) is almost always smaller than the true value, which is often explained away as sample deformation, the formation of salt deposits and/or dehydration. We show that the real height of nano-objects cannot be obtained directly: a result arising as a consequence of the local probe-sample geometry. Methods and Findings We have modeled the tip-surface-sample interaction as the sum of the interaction between the tip and the surface and the tip and the sample. We find that the dynamics of the AFM cannot differentiate between differences in force resulting from 1) the chemical and/or mechanical characteristics of the surface or 2) a step in topography due to the size of the sample; once the size of a feature becomes smaller than the effective area of interaction between the AFM tip and sample, the measured height is compromised. This general result is a major contributor to loss of height and can amount to up to ∼90% for nanoscale features. In particular, these very large values in height loss may occur even when there is no sample deformation, and, more generally, height loss does not correlate with sample deformation. DNA and IgG antibodies have been used as model samples where experimental height measurements are shown to closely match the predicted phenomena. Conclusions Being able to measure the true height of single nanoscale features is paramount in many nanotechnology applications since phenomena and properties in the nanoscale critically depend on dimensions. Our approach allows accurate predictions for the true height of nanoscale objects and will lead to reliable mechanical characterization at the highest spatial resolution. PMID:21912608

  6. Atomic force microscope nanolithography: dip-pen, nanoshaving, nanografting, tapping mode, electrochemical and thermal nanolithography.

    PubMed

    Rosa, Luis G; Liang, Jian

    2009-12-01

    Atomic force microscopy (AFM) has been widely employed as a nanoscopic lithography technique. In this review, we summarize the current state of research in this field. We introduce the various forms of the technique, such as nanoshaving, nanografting and dip-pen nanolithography, which we classify according to the different interactions between the AFM probe and the substrate during the nanolithography fabrication process. Mechanical force, applied by the tip to the substrate, is the variable that can be controlled with good precision in AFM and it has been utilized in patterning self-assembled monolayers. In such applications, the AFM tip can break some relatively weak chemical bonds inside the monolayer. In general, the state of the art for AFM nanolithography demonstrates the power, resolution and versatility of the technique. PMID:21832507

  7. Microscopic Analysis of Current and Mechanical Properties of Nafion® Studied by Atomic Force Microscopy

    PubMed Central

    Hiesgen, Renate; Helmly, Stefan; Galm, Ines; Morawietz, Tobias; Handl, Michael; Friedrich, K. Andreas

    2012-01-01

    The conductivity of fuel cell membranes as well as their mechanical properties at the nanometer scale were characterized using advanced tapping mode atomic force microscopy (AFM) techniques. AFM produces high-resolution images under continuous current flow of the conductive structure at the membrane surface and provides some insight into the bulk conducting network in Nafion membranes. The correlation of conductivity with other mechanical properties, such as adhesion force, deformation and stiffness, were simultaneously measured with the current and provided an indication of subsurface phase separations and phase distribution at the surface of the membrane. The distribution of conductive pores at the surface was identified by the formation of water droplets. A comparison of nanostructure models with high-resolution current images is discussed in detail. PMID:24958429

  8. Imaging Carbon Nanotubes in High Performance Polymer Composites via Magnetic Force Microscope

    NASA Technical Reports Server (NTRS)

    Lillehei, Peter T.; Park, Cheol; Rouse, Jason H.; Siochi, Emilie J.; Bushnell, Dennis M. (Technical Monitor)

    2002-01-01

    Application of carbon nanotubes as reinforcement in structural composites is dependent on the efficient dispersion of the nanotubes in a high performance polymer matrix. The characterization of such dispersion is limited by the lack of available tools to visualize the quality of the matrix/carbon nanotube interaction. The work reported herein demonstrates the use of magnetic force microscopy (MFM) as a promising technique for characterizing the dispersion of nanotubes in a high performance polymer matrix.

  9. Direct visualization and identification of biofunctionalized nanoparticles using a magnetic atomic force microscope.

    PubMed

    Block, Stephan; Glöckl, Gunnar; Weitschies, Werner; Helm, Christiane A

    2011-09-14

    Because of its outstanding ability to image and manipulate single molecules, atomic force microscopy (AFM) established itself as a fundamental technique in nanobiotechnology. (1) We present a new modality that distinguishes single nanoparticles by the surrounding magnetic field gradient. Diamagnetic gold and superparamagnetic iron oxide nanoparticles become discernible under ambient conditions. Images of proteins, magnetolabeled with nanoparticles, demonstrate the first steps toward a magnetic analogue to fluorescence microscopy, which combines nanoscale lateral resolution of AFM with unambiguous detection of magnetic markers. PMID:21819124

  10. Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging

    SciTech Connect

    Ovchinnikova, Olga S; Kjoller, Kevin; Hurst, Gregory {Greg} B; Pelletier, Dale A; Van Berkel, Gary J

    2014-01-01

    This paper reports on the development of a hybrid atmospheric pressure atomic force microscopy/mass spectrometry imaging system utilizing nano-thermal analysis probes for thermal desorption surface sampling with subsequent atmospheric pressure chemical ionization and mass analysis. The basic instrumental setup and the general operation of the system were discussed and optimized performance metrics were presented. The ability to correlate topographic images of a surface with atomic force microscopy and a mass spectral chemical image of the same surface, utilizing the same probe without moving the sample from the system, was demonstrated. Co-registered mass spectral chemical images and atomic force microscopy topographical images were obtained from inked patterns on paper as well as from a living bacterial colony on an agar gel. Spatial resolution of the topography images based on pixel size (0.2 m x 0.8 m) was better than the resolution of the mass spectral images (2.5 m x 2.0 m), which were limited by current mass spectral data acquisition rate and system detection levels.

  11. Exploring the retention properties of CaF2 nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid.

    PubMed

    Wasem, Matthias; Köser, Joachim; Hess, Sylvia; Gnecco, Enrico; Meyer, Ernst

    2014-01-13

    Amplitude-modulation atomic force microscopy (AM-AFM) is used to determine the retention properties of CaF2 nanoparticles adsorbed on mica and on tooth enamel in liquid. From the phase-lag of the forced cantilever oscillation the local energy dissipation at the detachment point of the nanoparticle was determined. This enabled us to compare different as-synthesized CaF2 nanoparticles that vary in shape, size and surface structure. CaF2 nanoparticles are candidates for additives in dental care products as they could serve as fluorine-releasing containers preventing caries during a cariogenic acid attack on the teeth. We show that the adherence of the nanoparticles is increased on the enamel substrate compared to mica, independently of the substrate roughness, morphology and size of the particles. PMID:24455460

  12. Exploring the retention properties of CaF2 nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

    PubMed Central

    Köser, Joachim; Hess, Sylvia; Gnecco, Enrico; Meyer, Ernst

    2014-01-01

    Summary Amplitude-modulation atomic force microscopy (AM-AFM) is used to determine the retention properties of CaF2 nanoparticles adsorbed on mica and on tooth enamel in liquid. From the phase-lag of the forced cantilever oscillation the local energy dissipation at the detachment point of the nanoparticle was determined. This enabled us to compare different as-synthesized CaF2 nanoparticles that vary in shape, size and surface structure. CaF2 nanoparticles are candidates for additives in dental care products as they could serve as fluorine-releasing containers preventing caries during a cariogenic acid attack on the teeth. We show that the adherence of the nanoparticles is increased on the enamel substrate compared to mica, independently of the substrate roughness, morphology and size of the particles. PMID:24455460

  13. Sensor for direct measurement of interaction forces in probe microscopy

    NASA Astrophysics Data System (ADS)

    Degertekin, F. L.; Onaran, A. G.; Balantekin, M.; Lee, W.; Hall, N. A.; Quate, C. F.

    2005-11-01

    We introduce a sensor for direct measurement of tip-sample interaction forces in probe microscopy. The sensor uses a micromachined membrane structure built on a transparent substrate with an integrated diffraction grating for optical interferometric detection, and a built-in electrostatic actuator. To demonstrate our concept for this sensor, we measured the force curves between an atomic force microscope (AFM) cantilever tip and a micromachined aluminum sensor membrane built on a quartz substrate. We also measured transient interaction forces exerted on the sensor membrane during each cycle of the vibrating AFM cantilever. These agree well with the temporal response of the sensor to a short force pulse applied by our integrated electrostatic actuator. With the addition of an integrated tip, this structure may be used for scanning probe microscopy with a bandwidth limited by the membrane dynamics.

  14. Quantitative characterization of crosstalk effects for friction force microscopy with scan-by-probe SPMs.

    PubMed

    Prunici, Pavel; Hess, Peter

    2008-06-01

    If the photodetector and cantilever of an atomic force microscope (AFM) are not properly adjusted, crosstalk effects will appear. These effects disturb measurements of the absolute vertical and horizontal cantilever deflections, which are involved in friction force microscopy (FFM). A straightforward procedure is proposed to study quantitatively crosstalk effects observed in scan-by-probe SPMs. The advantage of this simple, fast, and accurate procedure is that no hardware change or upgrade is needed. The results indicate that crosstalk effects depend not only on the alignment of the detector but also on the cantilever properties, position, and detection conditions. The measurements may provide information on the origin of the crosstalk effect. After determination of its magnitude, simple correction formulas can be applied to correct the crosstalk effects and then the single-load wedge method, using a commercially available grating, can be employed for accurate calibration of the lateral force. PMID:18035500

  15. Analysis of atomic force microscopic results of InAs islands formed by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Gong, Q.; Liang, J. B.; Xu, B.; Ding, D.; Li, H. X.; Jiang, C.; Zhou, W.; Liu, F. Q.; Wang, Z. G.; Qiu, X. H.; Shang, G. Y.; Bai, C. L.

    1998-09-01

    Atomic force microscopy (AFM) measurements of nanometer-sized islands formed by 2 monolayers of InAs by molecular beam epitaxy have been carried out and the scan line of individual islands was extracted from raw AFM data for investigation. It is found that the base widths of nanometer-sized islands obtained by AFM are not reliable due to the finite size and shape of the contacting probe. A simple model is proposed to analyze the deviation of the measured value from the real value of the base width of InAs islands.

  16. Atomic force microscope studies of fullerene films - Highly stable C60 fcc (311) free surfaces

    NASA Technical Reports Server (NTRS)

    Snyder, Eric J.; Tong, William M.; Williams, R. S.; Anz, Samir J.; Anderson, Mark S.

    1991-01-01

    Atomic force microscopy and X-ray diffractometry were used to study 1500 A-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrte. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

  17. Note: Mechanical etching of atomic force microscope tip and microsphere attachment for thermal radiation scattering enhancement

    NASA Astrophysics Data System (ADS)

    Brissinger, D.; Parent, G.; Lacroix, D.

    2013-12-01

    This Note describes a mechanical etching technique which can be used to prepare silicon tips used in atomic force microscopy apparatus. For such devices, dedicated tips with specific shapes are now commonly used to probe surfaces. Yet, the control of the tip morphology where characteristic scales are lower than 1 μm remains a real challenge. Here, we detail a controlled etching process of AFM probes apex allowing micrometer-sized sphere attachment. The technique used and influent parameters are discussed and SEM images of the achieved tips are given. Deceptive problems and drawbacks that might occur during the process are also covered.

  18. Sobol method application in dimensional sensitivity analyses of different AFM cantilevers for biological particles

    NASA Astrophysics Data System (ADS)

    Korayem, M. H.; Taheri, M.; Ghahnaviyeh, S. D.

    2015-08-01

    Due to the more delicate nature of biological micro/nanoparticles, it is necessary to compute the critical force of manipulation. The modeling and simulation of reactions and nanomanipulator dynamics in a precise manipulation process require an exact modeling of cantilevers stiffness, especially the stiffness of dagger cantilevers because the previous model is not useful for this investigation. The stiffness values for V-shaped cantilevers can be obtained through several methods. One of them is the PBA method. In another approach, the cantilever is divided into two sections: a triangular head section and two slanted rectangular beams. Then, deformations along different directions are computed and used to obtain the stiffness values in different directions. The stiffness formulations of dagger cantilever are needed for this sensitivity analyses so the formulations have been driven first and then sensitivity analyses has been started. In examining the stiffness of the dagger-shaped cantilever, the micro-beam has been divided into two triangular and rectangular sections and by computing the displacements along different directions and using the existing relations, the stiffness values for dagger cantilever have been obtained. In this paper, after investigating the stiffness of common types of cantilevers, Sobol sensitivity analyses of the effects of various geometric parameters on the stiffness of these types of cantilevers have been carried out. Also, the effects of different cantilevers on the dynamic behavior of nanoparticles have been studied and the dagger-shaped cantilever has been deemed more suitable for the manipulation of biological particles.

  19. Immobilized diaphorase surfaces observed by scanning electrochemical microscope with shear force based tip-substrate positioning.

    PubMed

    Yamada, Hiroshi; Fukumoto, Hikaru; Yokoyama, Tetsuya; Koike, Tohru

    2005-03-15

    Imaging of a coimmobilized diaphorase and albumin surface was investigated by scanning electrochemical microscopy (SECM) with shear force based tip-substrate distance control. A microelectrode tip was attached to a commercially available tuning fork to detect the shear force between the microelectrode tip and the surface. We used the standing approach mode, which repeats an approach and retraction at each data point of the surface to obtain simultaneous current and topographic images. To check the performance of our SECM system, we imaged a platinum-patterned array electrode and a diaphorase/albumin coimmobilized glass surface. Since the system acquires current when the tip is retracted to a desired distance, this mode is useful for a relatively large microelectrode (approximately 10 microm) and for scanning a large area (few hundreds of micrometers). Furthermore, by retracting the tip when the tip moves laterally to the next data point to avoid contact between the tip and sample surface, we successfully imaged the surface without destroying its morphology. PMID:15762586

  20. Atomic force microscopic study of the structure of high-density polyethylene deformed in liquid medium by crazing mechanism.

    PubMed

    Bagrov, D V; Yarysheva, A Y; Rukhlya, E G; Yarysheva, L M; Volynskii, A L; Bakeev, N F

    2014-02-01

    A procedure has been developed for the direct atomic force microscopic (AFM) examination of the native structure of high-density polyethylene (HDPE) deformed in an adsorption-active liquid medium (AALM) by the crazing mechanism. The AFM investigation has been carried out in the presence of a liquid medium under conditions preventing deformed films from shrinkage. Deformation of HDPE in AALM has been shown to proceed through the delocalized crazing mechanism and result in the development of a fibrillar-porous structure. The structural parameters of the crazed polymer have been determined. The obtained AFM images demonstrate a nanosized nonuniformity of the deformation and enable one to observe the structural rearrangements that take place in the deformed polymer after removal of the liquid medium and stress relaxation. A structural similarity has been revealed between HDPE deformed in the AALM and hard elastic polymers. PMID:24283329