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Sample records for hma overlay thickness

  1. Structural evolution of the Pb/Si(111) interface with metal overlayer thickness

    NASA Astrophysics Data System (ADS)

    Souto-Casares, Jaime; Chan, Tzu-Liang; Chelikowsky, James R.; Ho, Kai-Ming; Wang, Cai-Zhuang; Zhang, S. B.

    2015-09-01

    We employ a real-space pseudopotential method to compute the structural energies of a prototypical metal-semiconductor interface. Specifically, we examine a Pb(111) film overlaid on a Si(111) substrate as a function of the metal thickness. For each layer of Pb, we fully relax the atomic coordinates and determine the lowest-energy structure. Owing to the lattice mismatch between the Pb and Si crystal structures, we consider a large supercell containing up to 1505 atoms for the largest system. Systems of this size remain challenging for most current computational approaches and require algorithms specifically designed for highly parallel computational platforms. We examine the structural properties of the interface with respect to the thickness of the metal overlayer, e.g., the corrugation of the profile of the Pb overlayer. The combined influence of the Si substrate and quantum confinement results in a rich profile for a transition between a thin overlayer (less than a few monolayers), where the corrugation is strong, and the bulk region (more than a half-dozen layers), where the overlaid Pb film is atomically flat. This work proves the feasibility of handling systems with such a level of complexity.

  2. Investigation of HMA compactability using GPR technique

    NASA Astrophysics Data System (ADS)

    Plati, Christina; Georgiou, Panos; Loizos, Andreas

    2014-05-01

    In-situ field density is often regarded as one of the most important controls used to ensure that an asphalt pavement being placed is of high quality. The achieved density results from the effectiveness of the applied compaction mode on the Hot Mix Asphalt (HMA) layer. It is worthwhile mentioning that the proper compaction of HMA increases pavement fatigue life, decreases the amount of permanent deformation or rutting, reduces the amount of oxidation or aging, decreases moisture damage or stripping, increases strength and internal stability, and may decrease slightly the amount of low-temperature cracking that may occur in the mix. Conventionally, the HMA density in the field is assessed by direct destructive methods, including through the cutting of samples or drilling cores. These methods are characterized by a high accuracy, although they are intrusive and time consuming. In addition, they provide local information, i.e. information only for the exact test location. To overcome these limitations, the use of non-intrusive techniques is often recommended. The Ground Penetrating Radar (GPR) technique is an example of a non-intrusive technique that has been increasingly used for pavement investigations over the years. GPR technology is practical and application-oriented with the overall design concept, as well as the hardware, usually dependent on the target type and the material composing the target and its surroundings. As the sophistication of operating practices increases, the technology matures and GPR becomes an intelligent sensor system. The intelligent sensing deals with the expanded range of GPR applications in pavements such as determining layer thickness, detecting subsurface distresses, estimating moisture content, detecting voids and others. In addition, the practice of using GPR to predict in-situ field density of compacted asphalt mixture material is still under development and research; however the related research findings seem to be promising

  3. HMA6 and HMA8 are two chloroplast Cu+-ATPases with different enzymatic properties

    PubMed Central

    Sautron, Emeline; Mayerhofer, Hubert; Giustini, Cécile; Pro, Danièle; Crouzy, Serge; Ravaud, Stéphanie; Pebay-Peyroula, Eva; Rolland, Norbert; Catty, Patrice; Seigneurin-Berny, Daphné

    2015-01-01

    Copper (Cu) plays a key role in the photosynthetic process as cofactor of the plastocyanin (PC), an essential component of the chloroplast photosynthetic electron transfer chain. Encoded by the nuclear genome, PC is translocated in its apo-form into the chloroplast and the lumen of thylakoids where it is processed to its mature form and acquires Cu. In Arabidopsis, Cu delivery into the thylakoids involves two transporters of the PIB-1 ATPases family, heavy metal associated protein 6 (HMA6) located at the chloroplast envelope and HMA8 at the thylakoid membrane. To gain further insight into the way Cu is delivered to PC, we analysed the enzymatic properties of HMA8 and compared them with HMA6 ones using in vitro phosphorylation assays and phenotypic tests in yeast. These experiments reveal that HMA6 and HMA8 display different enzymatic properties: HMA8 has a higher apparent affinity for Cu+ but a slower dephosphorylation kinetics than HMA6. Modelling experiments suggest that these differences could be explained by the electrostatic properties of the Cu+ releasing cavities of the two transporters and/or by the different nature of their cognate Cu+ acceptors (metallochaperone/PC). PMID:26182363

  4. Expression of HMA4 cDNAs of the zinc hyperaccumulator Noccaea caerulescens from endogenous NcHMA4 promoters does not complement the zinc-deficiency phenotype of the Arabidopsis thaliana hma2hma4 double mutant

    PubMed Central

    Iqbal, Mazhar; Nawaz, Ismat; Hassan, Zeshan; Hakvoort, Henk W. J.; Bliek, Mattijs; Aarts, Mark G.M.; Schat, Henk

    2013-01-01

    Noccaea caerulescens (Nc) exhibits a very high constitutive expression of the heavy metal transporting ATPase, HMA4, as compared to the non-hyperaccumulator Arabidopsis thaliana (At), due to copy number expansion and altered cis-regulation. We screened a BAC library for HMA4 and found that HMA4 is triplicated in the genome of a N. caerulescens accession from a former Zn mine near La Calamine (LC), Belgium. We amplified multiple HMA4 promoter sequences from three calamine N. caerulescens accessions, and expressed AtHMA4 and different NcHMA4 cDNAs under At and Nc HMA4 promoters in the A. thaliana (Col) hma2hma4 double mutant. Transgenic lines expressing HMA4 under the At promoter were always fully complemented for root-to-shoot Zn translocation and developed normally at a 2-μM Zn supply, whereas the lines expressing HMA4 under Nc promoters usually showed only slightly enhanced root to shoot Zn translocation rates in comparison with the double mutant, probably owing to ectopic expression in the roots, respectively. When expression of the Zn deficiency responsive marker gene ZIP4 was tested, the transgenic lines expressing AtHMA4 under an NcHMA4-1-LC promoter showed on average a 7-fold higher expression in the leaves, in comparison with the double hma2hma4 mutant, showing that this construct aggravated, rather than alleviated the severity of foliar Zn deficiency in the mutant, possible owing to expression in the leaf mesophyll. PMID:24187545

  5. Electrooxidation of carbon monoxide and methanol on platinum-overlayer-coated gold nanoparticles: effects of film thickness.

    PubMed

    Kumar, Sachin; Zou, Shouzhong

    2007-06-19

    The electrooxidation of carbon monoxide and methanol on Pt-coated Au nanoparticles attached to 3-aminopropyl trimethoxysilane-modified indium tin oxide electrodes was examined as a function of Pt film thickness and Au particle coverage. For the electrodes with medium and high Au particle coverages, the CO stripping peak position shifts to more negative values with increasing Pt film thickness, from ca. 0.8 V (vs Ag/AgCl) at 1 ML to 0.45 V at 10 ML. Accompanying this peak potential shift is the sharpening of the peak width from more than 150 to 65 mV. For the electrode with low Au particle coverage, similar peak width narrowing was also observed, but the peak potential shift is much smaller, from 0.85 V at 1 ML of Pt to 0.65 V at 10 ML. These observations are compared with the CO oxidation on bulk Pt electrodes and on Pt films deposited on bulk Au electrodes. The film-thickness-dependent CO oxidation is explained by d band theory in terms of strain and ligand effects, the particle size effect, and the particle aggregation induced by Pt film growth. Corresponding to the increasing CO oxidation activity, the current density of methanol oxidation grows with the Pt film thickness. The peak potential and current density reach the same values as those obtained on a polycrystalline bulk Pt electrode when more than 4 ML of Pt is deposited on the Au particle electrodes with a particle coverage higher than 0.25. These results suggest that it is feasible to reduce Pt loading in methanol fuel cells by using Pt thin films as the anode catalyst. PMID:17521203

  6. Flutter Sensitivity to Boundary Layer Thickness, Structural Damping, and Static Pressure Differential for a Shuttle Tile Overlay Repair Concept

    NASA Technical Reports Server (NTRS)

    Scott, Robert C.; Bartels, Robert E.

    2009-01-01

    This paper examines the aeroelastic stability of an on-orbit installable Space Shuttle patch panel. CFD flutter solutions were obtained for thick and thin boundary layers at a free stream Mach number of 2.0 and several Mach numbers near sonic speed. The effect of structural damping on these flutter solutions was also examined, and the effect of structural nonlinearities associated with in-plane forces in the panel was considered on the worst case linear flutter solution. The results of the study indicated that adequate flutter margins exist for the panel at the Mach numbers examined. The addition of structural damping improved flutter margins as did the inclusion of nonlinear effects associated with a static pressure difference across the panel.

  7. Generic Overlay Framework

    Energy Science and Technology Software Center (ESTSC)

    2005-09-01

    This software provides a framework for building application layter overlay networks. It includes example overlays that can be used without modification. Also provided are example multicast and routing protocols that can be used with the overlays.

  8. Overlay accuracy fundamentals

    NASA Astrophysics Data System (ADS)

    Kandel, Daniel; Levinski, Vladimir; Sapiens, Noam; Cohen, Guy; Amit, Eran; Klein, Dana; Vakshtein, Irina

    2012-03-01

    Currently, the performance of overlay metrology is evaluated mainly based on random error contributions such as precision and TIS variability. With the expected shrinkage of the overlay metrology budget to < 0.5nm, it becomes crucial to include also systematic error contributions which affect the accuracy of the metrology. Here we discuss fundamental aspects of overlay accuracy and a methodology to improve accuracy significantly. We identify overlay mark imperfections and their interaction with the metrology technology, as the main source of overlay inaccuracy. The most important type of mark imperfection is mark asymmetry. Overlay mark asymmetry leads to a geometrical ambiguity in the definition of overlay, which can be ~1nm or less. It is shown theoretically and in simulations that the metrology may enhance the effect of overlay mark asymmetry significantly and lead to metrology inaccuracy ~10nm, much larger than the geometrical ambiguity. The analysis is carried out for two different overlay metrology technologies: Imaging overlay and DBO (1st order diffraction based overlay). It is demonstrated that the sensitivity of DBO to overlay mark asymmetry is larger than the sensitivity of imaging overlay. Finally, we show that a recently developed measurement quality metric serves as a valuable tool for improving overlay metrology accuracy. Simulation results demonstrate that the accuracy of imaging overlay can be improved significantly by recipe setup optimized using the quality metric. We conclude that imaging overlay metrology, complemented by appropriate use of measurement quality metric, results in optimal overlay accuracy.

  9. Functional analysis of the three HMA4 copies of the metal hyperaccumulator Arabidopsis halleri.

    PubMed

    Nouet, Cécile; Charlier, Jean-Benoit; Carnol, Monique; Bosman, Bernard; Farnir, Frédéric; Motte, Patrick; Hanikenne, Marc

    2015-09-01

    In Arabidopsis halleri, the HMA4 gene has an essential function in Zn/Cd hypertolerance and hyperaccumulation by mediating root-to-shoot translocation of metals. Constitutive high expression of AhHMA4 results from a tandem triplication and cis-activation of the promoter of all three copies. The three AhHMA4 copies possess divergent promoter sequences, but highly conserved coding sequences, and display identical expression profiles in the root and shoot vascular system. Here, an AhHMA4::GFP fusion was expressed under the control of each of the three A. halleri HMA4 promoters in a hma2hma4 double mutant of A. thaliana to individually examine the function of each AhHMA4 copy. The protein showed non-polar localization at the plasma membrane of the root pericycle cells of both A. thaliana and A. halleri. The expression of each AhHMA4::GFP copy complemented the severe Zn-deficiency phenotype of the hma2hma4 mutant by restoring root-to-shoot translocation of Zn. However, each copy had a different impact on metal homeostasis in the A. thaliana genetic background: AhHMA4 copies 2 and 3 were more highly expressed and provided higher Zn tolerance in roots and accumulation in shoots than copy 1, and AhHMA4 copy 3 also increased Cd tolerance in roots. These data suggest a certain extent of functional differentiation among the three A. halleri HMA4 copies, stemming from differences in expression levels rather than in expression profile. HMA4 is a key node of the Zn homeostasis network and small changes in expression level can have a major impact on Zn allocation to root or shoot tissues. PMID:26044091

  10. Functional analysis of the three HMA4 copies of the metal hyperaccumulator Arabidopsis halleri

    PubMed Central

    Nouet, Cécile; Charlier, Jean-Benoit; Carnol, Monique; Bosman, Bernard; Farnir, Frédéric; Motte, Patrick; Hanikenne, Marc

    2015-01-01

    In Arabidopsis halleri, the HMA4 gene has an essential function in Zn/Cd hypertolerance and hyperaccumulation by mediating root-to-shoot translocation of metals. Constitutive high expression of AhHMA4 results from a tandem triplication and cis-activation of the promoter of all three copies. The three AhHMA4 copies possess divergent promoter sequences, but highly conserved coding sequences, and display identical expression profiles in the root and shoot vascular system. Here, an AhHMA4::GFP fusion was expressed under the control of each of the three A. halleri HMA4 promoters in a hma2hma4 double mutant of A. thaliana to individually examine the function of each AhHMA4 copy. The protein showed non-polar localization at the plasma membrane of the root pericycle cells of both A. thaliana and A. halleri. The expression of each AhHMA4::GFP copy complemented the severe Zn-deficiency phenotype of the hma2hma4 mutant by restoring root-to-shoot translocation of Zn. However, each copy had a different impact on metal homeostasis in the A. thaliana genetic background: AhHMA4 copies 2 and 3 were more highly expressed and provided higher Zn tolerance in roots and accumulation in shoots than copy 1, and AhHMA4 copy 3 also increased Cd tolerance in roots. These data suggest a certain extent of functional differentiation among the three A. halleri HMA4 copies, stemming from differences in expression levels rather than in expression profile. HMA4 is a key node of the Zn homeostasis network and small changes in expression level can have a major impact on Zn allocation to root or shoot tissues. PMID:26044091

  11. Density measurements of road overlays samples with nuclear gauges and a Step Frequency Radar

    NASA Astrophysics Data System (ADS)

    Fauchard, C.; Li, B.; Kadi, M.

    2012-04-01

    The density of Hot-Mix Asphalt layers (HMA) and thin overlays is an important parameter for the pavement quality and its long time performance. In the laboratory, the density could be measured with nuclear gauges based on the gamma rays absorption through cores samples drilled from the pavement. However, it is a destructive testing. For in-place control, the density could be measured with nuclear gauges based on the back-scattered gamma rays. But it is limited to overlays thickness greater than 3 cm. For both cases, nuclear gauges require specific training and certification for users. The use of a nuclear source (generally Cesium 137) is a major constraint for transportation and is a threat for operator safety. This work proposes a laboratory density measurement with an electromagnetic method, the Step Frequency Radar developped in our institute (Fauchard et al, 2009). It is based on the same physical principle than the Ground Penetrating Radar, but the used frequencies allow the study of very thin asphalt overlays less than 3 cm and the possible non-destructive measurement of in-place density with high performance. For this study, the dimensions of the device are designed to measure the density of slab samples (40*60*8 cm) in laboratory. The results are compared to the nuclear density measurement used in French Labs. Three kinds of slabs are implemented with four various degrees of compaction (88, 90, 92 and 94%) according to the French norm. Their composition is known and differs mainly with the nature of the aggregates (basalt, quartzite and limestone) that represent the main part of the mix materials. Then the permittivity of the samples is measured according to the reflected waves on surface and bottom slabs. A Complex Refractive Index Model gives the measured permittivity of the tested mix as a function of the compaction and the content, permittiviy and density of each component (filler, aggregates and bitumen). The obtained density is very closed to the

  12. New holographic overlays

    NASA Astrophysics Data System (ADS)

    Hopwood, Anthony I.

    1991-10-01

    This paper discusses a new type of holographic overlay, FLASHPRINT, which may be used in both security and packaging applications. Unlike the more common embossed holograms currently used, FLASHPRINT leads to reduced set-up costs and offers a simpler process. This reduces the long lead times characteristic of the existing technology and requires the customer to provide only two-dimensional artwork. The overlay material contains a covert 2-D image. The image may be switched on or off by simply tilting the overlay in a light source. The overlay is replayed in the 'on' position to reveal the encoded security message as a highly saturated gold colored image. This effect is operable for a wide range of lighting conditions and viewing geometries. In the 'off' position the overlay is substantially transparent. These features make the visual effect of the overlay attractive to incorporate into product design. They may be laminated over complex printed artwork such as labels and security passes without masking the printed message. When switched 'on' the image appears both sharp and more than seven times brighter than white paper. The image remains sharp and clear even in less favorable lighting conditions. Although the technique offers a low set-up cost for the customer, through its simplicity, it remains as technically demanding and difficult to counterfeit as any holographic process.

  13. Genome-Wide Analysis and Heavy Metal-Induced Expression Profiling of the HMA Gene Family in Populus trichocarpa.

    PubMed

    Li, Dandan; Xu, Xuemei; Hu, Xiaoqing; Liu, Quangang; Wang, Zhanchao; Zhang, Haizhen; Wang, Han; Wei, Ming; Wang, Hanzeng; Liu, Haimei; Li, Chenghao

    2015-01-01

    The heavy metal ATPase (HMA) family plays an important role in transition metal transport in plants. However, this gene family has not been extensively studied in Populus trichocarpa. We identified 17 HMA genes in P. trichocarpa (PtHMAs), of which PtHMA1-PtHMA4 belonged to the zinc (Zn)/cobalt (Co)/cadmium (Cd)/lead (Pb) subgroup, and PtHMA5-PtHMA8 were members of the copper (Cu)/silver (Ag) subgroup. Most of the genes were localized to chromosomes I and III. Gene structure, gene chromosomal location, and synteny analyses of PtHMAs indicated that tandem and segmental duplications likely contributed to the expansion and evolution of the PtHMAs. Most of the HMA genes contained abiotic stress-related cis-elements. Tissue-specific expression of PtHMA genes showed that PtHMA1 and PtHMA4 had relatively high expression levels in the leaves, whereas Cu/Ag subgroup (PtHMA5.1- PtHMA8) genes were upregulated in the roots. High concentrations of Cu, Ag, Zn, Cd, Co, Pb, and Mn differentially regulated the expression of PtHMAs in various tissues. The preliminary results of the present study generated basic information on the HMA family of Populus that may serve as foundation for future functional studies. PMID:26779188

  14. Genome-Wide Analysis and Heavy Metal-Induced Expression Profiling of the HMA Gene Family in Populus trichocarpa

    PubMed Central

    Li, Dandan; Xu, Xuemei; Hu, Xiaoqing; Liu, Quangang; Wang, Zhanchao; Zhang, Haizhen; Wang, Han; Wei, Ming; Wang, Hanzeng; Liu, Haimei; Li, Chenghao

    2015-01-01

    The heavy metal ATPase (HMA) family plays an important role in transition metal transport in plants. However, this gene family has not been extensively studied in Populus trichocarpa. We identified 17 HMA genes in P. trichocarpa (PtHMAs), of which PtHMA1–PtHMA4 belonged to the zinc (Zn)/cobalt (Co)/cadmium (Cd)/lead (Pb) subgroup, and PtHMA5–PtHMA8 were members of the copper (Cu)/silver (Ag) subgroup. Most of the genes were localized to chromosomes I and III. Gene structure, gene chromosomal location, and synteny analyses of PtHMAs indicated that tandem and segmental duplications likely contributed to the expansion and evolution of the PtHMAs. Most of the HMA genes contained abiotic stress-related cis-elements. Tissue-specific expression of PtHMA genes showed that PtHMA1 and PtHMA4 had relatively high expression levels in the leaves, whereas Cu/Ag subgroup (PtHMA5.1- PtHMA8) genes were upregulated in the roots. High concentrations of Cu, Ag, Zn, Cd, Co, Pb, and Mn differentially regulated the expression of PtHMAs in various tissues. The preliminary results of the present study generated basic information on the HMA family of Populus that may serve as foundation for future functional studies. PMID:26779188

  15. Effect of Perovskite Overlayers on TiO2 Electrodes in Perovskite-Sensitized Solar Cells.

    PubMed

    Kim, Kang-Pil; Kim, Jeong-Hwa; Hwang, Dae-Kue

    2016-05-01

    In this paper, we have studied the effect of the thickness of a CH3NH3PbI3 perovskite overlayer on mesoporous TiO2 electrodes in perovskite solar cells. The overlayers were prepared by spin coating PbI2 films on the electrodes, which were subsequently exposed to a CH3NH3I/2-propanol solution. We controlled the thickness of the perovskite overlayer by changing the PbI2 solution concentration. The thicknesses of the overlayers spin-coated from 0.5, 0.75, 0.9, and 1 M PbI2 solutions were approximately 179, 262, 316, and 341 nm, respectively. Perovskite solar cells with an approximately 316-nm-thick overlayer showed the highest efficiency of 9.11%. We conclude that optimization of the perovskite overlayer thickness in the solar cell structure is necessary to improve the cell efficiency. PMID:27483921

  16. Diffraction based overlay metrology for α-carbon applications

    NASA Astrophysics Data System (ADS)

    Saravanan, Chandra Saru; Tan, Asher; Dasari, Prasad; Goelzer, Gary; Smith, Nigel; Woo, Seouk-Hoon; Shin, Jang Ho; Kang, Hyun Jae; Kim, Ho Chul

    2008-03-01

    Applications that require overlay measurement between layers separated by absorbing interlayer films (such as α- carbon) pose significant challenges for sub-50nm processes. In this paper scatterometry methods are investigated as an alternative to meet these stringent overlay metrology requirements. In this article, a spectroscopic Diffraction Based Overlay (DBO) measurement technique is used where registration errors are extracted from specially designed diffraction targets. DBO measurements are performed on detailed set of wafers with varying α-carbon (ACL) thicknesses. The correlation in overlay values between wafers with varying ACL thicknesses will be discussed. The total measurement uncertainty (TMU) requirements for these layers are discussed and the DBO TMU results from sub-50nm samples are reviewed.

  17. Tandem quadruplication of HMA4 in the zinc (Zn) and cadmium (Cd) hyperaccumulator Noccaea caerulescens.

    PubMed

    Ó Lochlainn, Seosamh; Bowen, Helen C; Fray, Rupert G; Hammond, John P; King, Graham J; White, Philip J; Graham, Neil S; Broadley, Martin R

    2011-01-01

    Zinc (Zn) and cadmium (Cd) hyperaccumulation may have evolved twice in the Brassicaceae, in Arabidopsis halleri and in the Noccaea genus. Tandem gene duplication and deregulated expression of the Zn transporter, HMA4, has previously been linked to Zn/Cd hyperaccumulation in A. halleri. Here, we tested the hypothesis that tandem duplication and deregulation of HMA4 expression also occurs in Noccaea.A Noccaea caerulescens genomic library was generated, containing 36,864 fosmid pCC1FOS™ clones with insert sizes ∼20-40 kbp, and screened with a PCR-generated HMA4 genomic probe. Gene copy number within the genome was estimated through DNA fingerprinting and pooled fosmid pyrosequencing. Gene copy numbers within individual clones was determined by PCR analyses with novel locus specific primers. Entire fosmids were then sequenced individually and reads equivalent to 20-fold coverage were assembled to generate complete whole contigs.Four tandem HMA4 repeats were identified in a contiguous sequence of 101,480 bp based on sequence overlap identities. These were flanked by regions syntenous with up and downstream regions of AtHMA4 in Arabidopsis thaliana. Promoter-reporter β-glucuronidase (GUS) fusion analysis of a NcHMA4 in A. thaliana revealed deregulated expression in roots and shoots, analogous to AhHMA4 promoters, but distinct from AtHMA4 expression which localised to the root vascular tissue.This remarkable consistency in tandem duplication and deregulated expression of metal transport genes between N. caerulescens and A. halleri, which last shared a common ancestor >40 mya, provides intriguing evidence that parallel evolutionary pathways may underlie Zn/Cd hyperaccumulation in Brassicaceae. PMID:21423774

  18. Tandem Quadruplication of HMA4 in the Zinc (Zn) and Cadmium (Cd) Hyperaccumulator Noccaea caerulescens

    PubMed Central

    Ó Lochlainn, Seosamh; Bowen, Helen C.; Fray, Rupert G.; Hammond, John P.; King, Graham J.; White, Philip J.; Graham, Neil S.; Broadley, Martin R.

    2011-01-01

    Zinc (Zn) and cadmium (Cd) hyperaccumulation may have evolved twice in the Brassicaceae, in Arabidopsis halleri and in the Noccaea genus. Tandem gene duplication and deregulated expression of the Zn transporter, HMA4, has previously been linked to Zn/Cd hyperaccumulation in A. halleri. Here, we tested the hypothesis that tandem duplication and deregulation of HMA4 expression also occurs in Noccaea. A Noccaea caerulescens genomic library was generated, containing 36,864 fosmid pCC1FOS™ clones with insert sizes ∼20–40 kbp, and screened with a PCR-generated HMA4 genomic probe. Gene copy number within the genome was estimated through DNA fingerprinting and pooled fosmid pyrosequencing. Gene copy numbers within individual clones was determined by PCR analyses with novel locus specific primers. Entire fosmids were then sequenced individually and reads equivalent to 20-fold coverage were assembled to generate complete whole contigs. Four tandem HMA4 repeats were identified in a contiguous sequence of 101,480 bp based on sequence overlap identities. These were flanked by regions syntenous with up and downstream regions of AtHMA4 in Arabidopsis thaliana. Promoter-reporter β-glucuronidase (GUS) fusion analysis of a NcHMA4 in A. thaliana revealed deregulated expression in roots and shoots, analogous to AhHMA4 promoters, but distinct from AtHMA4 expression which localised to the root vascular tissue. This remarkable consistency in tandem duplication and deregulated expression of metal transport genes between N. caerulescens and A. halleri, which last shared a common ancestor >40 mya, provides intriguing evidence that parallel evolutionary pathways may underlie Zn/Cd hyperaccumulation in Brassicaceae. PMID:21423774

  19. Accuracy in optical overlay metrology

    NASA Astrophysics Data System (ADS)

    Bringoltz, Barak; Marciano, Tal; Yaziv, Tal; DeLeeuw, Yaron; Klein, Dana; Feler, Yoel; Adam, Ido; Gurevich, Evgeni; Sella, Noga; Lindenfeld, Ze'ev; Leviant, Tom; Saltoun, Lilach; Ashwal, Eltsafon; Alumot, Dror; Lamhot, Yuval; Gao, Xindong; Manka, James; Chen, Bryan; Wagner, Mark

    2016-03-01

    In this paper we discuss the mechanism by which process variations determine the overlay accuracy of optical metrology. We start by focusing on scatterometry, and showing that the underlying physics of this mechanism involves interference effects between cavity modes that travel between the upper and lower gratings in the scatterometry target. A direct result is the behavior of accuracy as a function of wavelength, and the existence of relatively well defined spectral regimes in which the overlay accuracy and process robustness degrades (`resonant regimes'). These resonances are separated by wavelength regions in which the overlay accuracy is better and independent of wavelength (we term these `flat regions'). The combination of flat and resonant regions forms a spectral signature which is unique to each overlay alignment and carries certain universal features with respect to different types of process variations. We term this signature the `landscape', and discuss its universality. Next, we show how to characterize overlay performance with a finite set of metrics that are available on the fly, and that are derived from the angular behavior of the signal and the way it flags resonances. These metrics are used to guarantee the selection of accurate recipes and targets for the metrology tool, and for process control with the overlay tool. We end with comments on the similarity of imaging overlay to scatterometry overlay, and on the way that pupil overlay scatterometry and field overlay scatterometry differ from an accuracy perspective.

  20. Characterization of overlay mark fidelity

    NASA Astrophysics Data System (ADS)

    Adel, Mike; Ghinovker, Mark; Poplawski, Jorge M.; Kassel, Elyakim; Izikson, Pavel; Pollentier, Ivan K.; Leray, Philippe; Laidler, David W.

    2003-05-01

    In this publication we introduce a new metric for process robustness of overlay metrology in microelectronic manufacturing. By straightforward statistical analysis of overlay metrology measurements on an array of adjacent, nominally identical overlay targets the Overlay Mark Fidelity (OMF) can be estimated. We present the results of such measurements and analysis on various marks, which were patterned using a DUV scanner. The same reticle set was used to pattern wafers on different process layers and process conditions. By appropriate statistical analysis, the breakdown of the total OMF into a reticle-induced OMF component and a process induced OMF component was facilitated. We compare the OMF of traditional box-in-box overlay marks with that of new gratingbased overlay marks and show that in all cases the grating marks are superior. The reticle related OMF showed an improvement of 30 % when using the new grating-based overlay mark. Furthermore, in a series of wafers run through an STI-process with different Chemical Mechanical Polish (CMP) times, the random component of the OMF of the new grating-based overlay mark was observed to be 40% lower and 50% less sensitive to process variation compared with Box in Box marks. These two observations are interpreted as improved process robustness of the grating mark over box in box, specifically in terms of reduced site by site variations and reduced wafer to wafer variations as process conditions change over time. Overlay Mark Fidelity, as defined in this publication, is a source of overlay metrology uncertainty, which is statistically independent of the standard error contributors, i.e. precision, TIS variability, and tool to tool matching. Current overlay metrology budgeting practices do not take this into consideration when calculating total measurement uncertainty (TMU). It is proposed that this be reconsidered, given the tightness of overlay and overlay metrology budgets at the 70 nm design rule node and below.

  1. Electrically conductive polymer concrete overlays

    NASA Astrophysics Data System (ADS)

    Fontana, J. J.; Webster, R. P.

    1984-08-01

    The use of cathodic protection to prevent the corrosion of reinforcing steel in concrete structures has been well established. Application of a durable, skid-resistant electrically conductive polymer concrete overlay would advance the use of cathodic protection for the highway industry. Laboratory studies indicate that electrically conductive polymer concrete overlays using conductive fillers, such as calcined coke breeze, in conjunction with polyester or vinyl ester resins have resistivities of 1 to 10 ohm-cm. Both multiple-layer and premixed mortar-type overlays were made. Shear bond strengths of the conductive overlays to concrete substrates vary from 600 to 1300 psi, with the premixed overlays having bond strengths 50 to 100% higher than the multiple-layer overlays.

  2. Envelopment technique and topographic overlays in bite mark analysis

    PubMed Central

    Djeapragassam, Parimala; Daniel, Mariappan Jonathan; Srinivasan, Subramanian Vasudevan; Ramadoss, Koliyan; Jimsha, Vannathan Kumaran

    2015-01-01

    Aims and Objectives: The aims and objectives of our study were to compare four sequential overlays generated using the envelopment technique and to evaluate inter- and intraoperator reliability of the overlays obtained by the envelopment technique. Materials and Methods: Dental stone models were prepared from impressions made from healthy individuals; photographs were taken and computer-assisted overlays were generated. The models were then enveloped in a different-color dental stone. After this, four sequential cuts were made at a thickness of 1mm each. Each sectional cut was photographed and overlays were generated. Thus, 125 overlays were generated and compared. Results: The scoring was done based on matching accuracy and the data were analyzed. The Kruskal-Wallis one-way analysis of variance (ANOVA) test was used to compare four sequential overlays and Spearman's rank correlation tests were used to evaluate the inter- and intraoperator reliability of the overlays obtained by the envelopment technique. Conclusion: Through our study, we conclude that the third and fourth cuts were the best among the four cuts and inter- and intraoperator reliability were found to be statistically significant at 5% level that is 95% confidence interval (P < 0.05). PMID:26816458

  3. A basic guide to overlay design using nondestructive testing equipment data

    NASA Astrophysics Data System (ADS)

    Turner, Vernon R.

    1990-08-01

    The purpose of this paper is to provide a basic and concise guide to designing asphalt concrete (AC) overlays over existing AC pavements. The basis for these designs is deflection data obtained from nondestructive testing (NDT) equipment. This data is used in design procedures which produce required overlay thickness or an estimate of remaining pavement life. This guide enables one to design overlays or better monitor the designs being performed by others. This paper will discuss three types of NDT equipment, the Asphalt Institute Overlay Designs by Deflection Analysis and by the effective thickness method as well as a method of estimating remaining pavement life, correlations between NDT equipment and recent correlations in Washington State. Asphalt overlays provide one of the most cost effective methods of improving existing pavements. Asphalt overlays can be used to strengthen existing pavements, to reduce maintenance costs, to increase pavement life, to provide a smoother ride, and to improve skid resistance.

  4. Overlay similarity: a new overlay index for metrology tool and scanner overlay fingerprint methodology

    NASA Astrophysics Data System (ADS)

    Ke, Chih-Ming; Kao, Ching-Pin; Wang, Yu-Hsi; Hu, Jimmy; Chang, Chen-Yu; Tsai, Ya-Jung; Yen, Anthony; Lin, Burn J.

    2009-03-01

    For different CD metrologies like average CD from CD SEM and optical CD (OCD) from scatterometry, CD point-to-point R2 has been well adopted as the CD correlation index. For different overlay metrologies like image-based box-in-box overlay and scatterometry-based overlay, we propose the cosine similarity as the correlation index of overlay. The cosine similarity is a measure of similarity between two vectors of n dimensions by finding the cosine of the angle between them, often used to compare documents in text mining. It has been widely used in web and document search engines and can be used as the similarity index of overlay tool-to-tool matching and scanner tool-to-tool or day-to-day fingerprint. In this paper, we demonstrate that the cosine similarity has a very high sensitivity to the overly tool performance. We compared the similarities of three generations (A1, A2, A3) of the overlay tools of venders A and B and found that after target re-training and TIS correction on each tool A1 similarity to A3 can be improved from 0.9837 to 0.9951. Overlay point-to-point matching with A3 vs. A1 can be reduced from 4.8 to 2.1 nm. The tool precision similarities, i.e. tool self best similarity, for A1, A2, A3 and B are 0.9986, 0.9990, 0.9995, and 0.9994 respectively. From this table, we demonstrate that we can use old-generation overlay tool with suitable hardware maintenance, to match to the latest-generation overlay tool.

  5. Overexpression of OsHMA3 enhances Cd tolerance and expression of Zn transporter genes in rice

    PubMed Central

    Sasaki, Akimasa; Yamaji, Naoki; Ma, Jian Feng

    2014-01-01

    As a member of the heavy metal ATPase (HMA) family, OsHMA3 is a tonoplast-localized transporter for Cd in the roots of rice (Oryza sativa). Overexpression of OsHMA3 selectively reduces Cd accumulation in the grain. Further characterization in the present study revealed that overexpression of OsHMA3 also enhances the tolerance to toxic Cd. The growth of both the roots and shoots was similar in the absence of Cd between an OsHMA3-overexpressed line and vector control, but the Cd-inhibited growth was significantly alleviated in the OsHMA3-overexpressed line. The overexpressed line showed higher Cd concentration in the roots, but lower Cd concentration in the shoots compared with the wild-type rice and vector control line, indicating that overexpression of OsHMA3 enhanced vacuolar sequestration of Cd in the roots. The Zn concentration in the roots of the OsHMA3-overexpressed line was constantly higher than that of vector control, but the Zn concentration in the shoots was similar between the overexpressed line and vector control. Five transporter genes belonging to the ZIP family were constitutively up-regulated in the OsHMA3-overexpressed line. These results suggest that shoot Zn level was maintained by up-regulating these genes involved in the Zn uptake/translocation. Taken together, overexpression of OsHMA3 is an efficient way to reduce Cd accumulation in the grain and to enhance Cd tolerance in rice. PMID:25151617

  6. Poplar maintains zinc homeostasis with heavy metal genes HMA4 and PCS1

    Technology Transfer Automated Retrieval System (TEKTRAN)

    This project has identified two large gene families, HMA and ZIP, in poplar that have been greatly expanded by the latest Salicoid genome duplication in poplar. In other species, these two families have been shown to be central in both hyperaccumulators and non-hyperaccumulators In poplar, many of t...

  7. New analytical algorithm for overlay accuracy

    NASA Astrophysics Data System (ADS)

    Ham, Boo-Hyun; Yun, Sangho; Kwak, Min-Cheol; Ha, Soon Mok; Kim, Cheol-Hong; Nam, Suk-Woo

    2012-03-01

    The extension of optical lithography to 2Xnm and beyond is often challenged by overlay control. With reduced overlay measurement error budget in the sub-nm range, conventional Total Measurement Uncertainty (TMU) data is no longer sufficient. Also there is no sufficient criterion in overlay accuracy. In recent years, numerous authors have reported new method of the accuracy of the overlay metrology: Through focus and through color. Still quantifying uncertainty in overlay measurement is most difficult work in overlay metrology. According to the ITRS roadmap, total overlay budget is getting tighter than former device node as a design rule shrink on each device node. Conventionally, the total overlay budget is defined as the square root of square sum of the following contributions: the scanner overlay performance, wafer process, metrology and mask registration. All components have been supplying sufficiently performance tool to each device nodes, delivering new scanner, new metrology tools, and new mask e-beam writers. Especially the scanner overlay performance was drastically decreased from 9nm in 8x node to 2.5nm in 3x node. The scanner overlay seems to reach the limitation the overlay performance after 3x nod. The importance of the wafer process overlay as a contribution of total wafer overlay became more important. In fact, the wafer process overlay was decreased by 3nm between DRAM 8x node and DRAM 3x node. We develop an analytical algorithm for overlay accuracy. And a concept of nondestructive method is proposed in this paper. For on product layer we discovered the layer has overlay inaccuracy. Also we use find out source of the overlay error though the new technique. In this paper, authors suggest an analytical algorithm for overlay accuracy. And a concept of non-destructive method is proposed in this paper. For on product layers, we discovered it has overlay inaccuracy. Also we use find out source of the overlay error though the new technique. Furthermore

  8. Fabrication of magnetic bubble memory overlay

    NASA Technical Reports Server (NTRS)

    1973-01-01

    Self-contained magnetic bubble memory overlay is fabricated by process that employs epitaxial deposition to form multi-layered complex of magnetically active components on single chip. Overlay fabrication comprises three metal deposition steps followed by subtractive etch.

  9. The big squeeze. CHS-HMA merger tightens the vise on independent hospitals.

    PubMed

    Kutscher, Beth

    2013-08-01

    News of the Community-HMA merger shows the increasing momentum for such deals. The merger will allow Community to diversify and find synergies where it can cut expenses. "The volumes are a little more critical in nonurban hospitals than urban hospitals. As 2014 gets here and we start enrolling people (in health insurance exchanges), then the revenue will start to grow," says Wayne Smith, left, Community's chairman, president and CEO. PMID:24010150

  10. Atom-probe and field emission electron spectroscopy studies of ordered structures and electronic properties of Ge overlayers on Ir-tips

    NASA Astrophysics Data System (ADS)

    Ashino, Makoto; Tomitori, Masahiko; Nishikawa, Osamu

    1994-03-01

    The combined instrument of an atom probe (AP) and a field emission electron spectroscope (FEES) was employed to investigate the crystallinity and the surface electronic state of Ge overlayers deposited on Ir tips. The crystallinity of Ge overlayers deposited at 300 and 420 K, and those annealed after the deposition, is better than that of the overlayers deposited at 50 K. The surface electronic state of the well-crystallized Ge overlayer is semiconductive at the thickness of ≈4 ML. When the degree of crystallinity is rather low or Ir atoms exist in the Ge overlayer, even a thick overlayer exhibits metallic surface electronic states. When an Ir atom exists on the overlayer surface, a small peak appears at ≈ 0.3 eV below the Fermi level in the field emission electron distribution (FEED), indicating a local state of the Ir atom.

  11. Meeting overlay requirements for future technology nodes with in-die overlay metrology

    NASA Astrophysics Data System (ADS)

    Schulz, Bernd; Seltmann, Rolf; Busch, Jens; Hempel, Fritjof; Cotte, Eric; Alles, Benjamin

    2007-03-01

    As a consequence of the shrinking sizes of the integrated circuit structures, the overlay budget shrinks as well. Overlay is traditionally measured with relatively large test structures which are located in the scribe line of the exposure field, in the four corners. Although the performance of the overlay metrology tools has improved significantly over time it is questionable if this traditional method of overlay control will be sufficient for future technology nodes. For advanced lithography techniques like double exposure or double patterning, in-die overlay is critical and it is important to know how much of the total overlay budget is consumed by in-die components. We reported earlier that small overlay targets were included directly inside die areas and good performance was achieved. This new methodology enables a wide range of investigations. This provides insight into processes which were less important in the past or not accessible for metrology. The present work provides actual data from productive designs, instead of estimates, illustrating the differences between the scribe line and in-die registration and overlay. The influence of the pellicle on pattern placement on mask and wafer overlay is studied. Furthermore the registration overlay error of the reticles is correlated to wafer overlay residuals. The influence of scanner-induced distortions (tool to tool differences) on in-die overlay is shown. Finally, the individual contributors to in-die-overlay are discussed in the context of other overlay contributors. It is proposed to use in-die overlay and registration results to derive guidelines for future overlay and registration specifications. It will be shown that new overlay correction schemes which take advantage of the additional in-die overlay information need to be considered for production.

  12. Urinary MDMA, MDA, HMMA, and HMA Excretion Following Controlled MDMA Administration to Humans

    PubMed Central

    Abraham, Tsadik T.; Barnes, Allan J.; Lowe, Ross H.; Spargo, Erin A. Kolbrich; Milman, Garry; Pirnay, Stephane O.; Gorelick, David A.; Goodwin, Robert S.; Huestis, Marilyn A.

    2011-01-01

    3,4-Methylenedioxymethamphetamine (MDMA), or ecstasy, is excreted as unchanged drug, 3,4-methylenedioxyamphetamine (MDA), and free and glucuronidated/sulfated 4-hydroxy-3-methoxymethamphetamine (HMMA), and 4-hydroxy-3-methoxyamphetamine (HMA) metabolites. The aim of this paper is to describe the pattern and timeframe of excretion of MDMA and its metabolites in urine. Placebo, 1.0 mg/kg, and 1.6 mg/kg oral MDMA doses were administered double-blind to healthy adult MDMA users on a monitored research unit. All urine was collected, aliquots were hydrolyzed, and analytes quantified by gas chromatography–mass spectrometry. Median Cmax, Tmax, ratios, first and last detection times, and detection rates were determined. Sixteen participants provided 916 urine specimens. After 1.6 mg/kg, median Cmax were 21,470 (MDMA), 2229 (MDA), 20,793 (HMMA), and 876 ng/mL (HMA) at median Tmax of 13.9, 23.0, 9.2 and 23.3 h. In the first 24 h, 30.2–34.3% total urinary excretion occurred. HMMA last detection exceeded MDMA’s by more than 33 h after both doses. Identification of HMMA as well as MDMA increased the ability to identify positive specimens but required hydrolysis. These MDMA, MDA, HMMA, and HMA pharmacokinetic data may be useful for interpreting workplace, drug treatment, criminal justice, and military urine drug tests. Measurement of urinary HMMA provides the longest detection of MDMA exposure yet is not included in routine monitoring procedures. PMID:19874650

  13. TES overlayed on MOLA DEM

    NASA Technical Reports Server (NTRS)

    1999-01-01

    This image is TES thermal data (Orbit 222) overlayed on the MOLA DEM. The color scale is TES T18-T25, which is a cold spot index. The grey scale is MOLA elevation in kilometers. Most cold spots can be attributed to surface spectral emissivity effects. Regions that are colored black-violet-blue have near unity emissivity and are coarse grained CO2. Regions that are yellow-red are fined grained CO2. The red-white spot located approximately 300W85N is our most likely candidate for a CO2 snow storm.

  14. Overlays for classroom and optometric use.

    PubMed

    Wilkins, A

    1994-01-01

    Perceptual distortion of printed text can sometimes be reduced by placing upon the page a sheet of coloured plastic (overlay). The colour that best reduces the distortion differs from one individual to another and may need to be selected with precision. A set of overlays has been developed that samples the CIE UCS diagram systematically. The overlays are robust and have a matte finish. They can be combined in an intuitive way to provide a wide range of chromaticities. PMID:7512256

  15. Total overlay analysis for designing future aligner

    NASA Astrophysics Data System (ADS)

    Magome, Nobutaka; Kawai, Hidemi

    1995-05-01

    We found total overlay with respect to optical lithography using an approach similar to quality control technique employed at a semiconductor factory. This approach involves an aligner performance, process quality, reticle error and overlay measurement. This paper further describes new ides for the number of machines to be used for matching and data collection period. Lastly, improvement on total overlay and a prospective view for a future aligner and its usage are also described.

  16. Analysis Of Overlay Distortion Patterns

    NASA Astrophysics Data System (ADS)

    Armitage, John D.; Kirk, Joseph P.

    1988-01-01

    A comprehensive geometrical approach is presented for the least-squares analysis of overlay distortion patterns into useful, physically meaningful systematic distortion subpatterns and an essentially non-systematic residue. A scheme of generally useful distortion sub-patterns is presented in graphic and algorithmic form; some of these sub-patterns are additions to those already in widespread use. A graphic and geometric approach is emphasized rather than an algebraic or statistical approach, and an example illustrates the value in utilizing the pattern-detecting ability of the eye-brain system. The conditions are described under which different distortion sub-patterns may interact, possibly leading to misleading or erroneous conclusions about the types and amounts of different distortions present. Examples of typical interaction situations are given, and recommendations are made for analytic procedures to avoid misinterpretation. It is noted that the lower-order distortion patterns preserve straight-line linearity, but that higher-order distortion may result in straight lines becoming curved. The principle of least-squares analysis is outlined and a simple polynomial data-fitting example is used to illustrate the method. Algorithms are presented for least-squares distortion analysis of overlay patterns, and an APL2 program is given to show how this may easily be implemented on a digital computer. The appendix extends the treatment to cases where small-angle approximation is not permissible.

  17. Modeling of Co overlayers on Pd (111) from first principles

    NASA Astrophysics Data System (ADS)

    Uba, S.; Uba, L.; Antonov, V. N.

    2007-04-01

    The electronic, magnetic and magneto-optical properties of Co overlayers on Pd (1 1 1) substrate have been investigated by ab initio band structure calculations within the spin-polarized relativistic linear muffin-thin orbitals (LMTO) method and supercell approach. The role of the Co-Pd interface structure, the number of the Co atomic layers ( n Co ), as well as the spin-orbit interaction and induced Pd spin polarization, in formation of magneto-optical response of the structures for [ n CoCo/Pd (1 1 1)] system is shown. The sign reversal of the polar Kerr rotation obtained theoretically with decreasing thickness of Co overlayers agrees well with experiment. We will demonstrate the effectiveness of the extended numeric modeling of magneto-optical properties from first principles.

  18. Structural basis of pathogen recognition by an integrated HMA domain in a plant NLR immune receptor

    PubMed Central

    Maqbool, A; Saitoh, H; Franceschetti, M; Stevenson, CEM; Uemura, A; Kanzaki, H; Kamoun, S; Terauchi, R; Banfield, MJ

    2015-01-01

    Plants have evolved intracellular immune receptors to detect pathogen proteins known as effectors. How these immune receptors detect effectors remains poorly understood. Here we describe the structural basis for direct recognition of AVR-Pik, an effector from the rice blast pathogen, by the rice intracellular NLR immune receptor Pik. AVR-PikD binds a dimer of the Pikp-1 HMA integrated domain with nanomolar affinity. The crystal structure of the Pikp-HMA/AVR-PikD complex enabled design of mutations to alter protein interaction in yeast and in vitro, and perturb effector-mediated response both in a rice cultivar containing Pikp and upon expression of AVR-PikD and Pikp in the model plant Nicotiana benthamiana. These data reveal the molecular details of a recognition event, mediated by a novel integrated domain in an NLR, which initiates a plant immune response and resistance to rice blast disease. Such studies underpin novel opportunities for engineering disease resistance to plant pathogens in staple food crops. DOI: http://dx.doi.org/10.7554/eLife.08709.001 PMID:26304198

  19. IMPERMEABLE THIN Al{sub 2}O{sub 3} OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2004-06-30

    In order to further improve the hot corrosion resistance of yttria-stabilized zirconia (YSZ), an Al{sub 2}O{sub 3} overlay of 58 {micro}m thick was deposited on the surface of YSZ by electron-beam physical vapor deposition. Hot corrosion tests were performed on the YSZ coatings with {gamma}-Al{sub 2}O{sub 3} overlay and {alpha}-Al{sub 2}O{sub 3} overlay in molten salt mixture (Na2SO4 + 5wt%V2O5) at 950 C. The {alpha}-Al{sub 2}O{sub 3} overlay was obtained by the post-annealing of g-Al{sub 2}O{sub 3} overlay at 1200 C for 1h. The results showed that compared with the hot corrosion resistance of YSZ coating with 25 {micro}m thick {gamma}-Al{sub 2}O{sub 3} overlay, either thickening {gamma}-Al{sub 2}O{sub 3} overlay or employing {alpha}-Al{sub 2}O{sub 3} overlay could impair the hot corrosion resistance of YSZ coating, because the tensile stresses developed in the alumina overlay in both cases due to the mismatch in thermal expansion coefficient (TEC) between alumina and zirconia resulted in cracking of Al{sub 2}O{sub 3} overlay. The formation of cracks increased contact area between molten salt and Al{sub 2}O{sub 3} overlay, and also the penetration rate of molten salt into Al{sub 2}O{sub 3} overlay and YSZ coating, leading a faster and greater degradation of YSZ coating upon exposure. In the next reporting period, we will study the effect of Al{sub 2}O{sub 3} overlay thickness on hot corrosion and spalling of YSZ coatings.

  20. Barley HvHMA1 Is a Heavy Metal Pump Involved in Mobilizing Organellar Zn and Cu and Plays a Role in Metal Loading into Grains

    PubMed Central

    Mikkelsen, Maria Dalgaard; Pedas, Pai; Schiller, Michaela; Vincze, Eva; Mills, Rebecca F.; Borg, Søren; Møller, Annette; Schjoerring, Jan K.; Williams, Lorraine E.; Baekgaard, Lone; Holm, Preben Bach; Palmgren, Michael G.

    2012-01-01

    Heavy metal transporters belonging to the P1B-ATPase subfamily of P-type ATPases are key players in cellular heavy metal homeostasis. Heavy metal transporters belonging to the P1B-ATPase subfamily of P-type ATPases are key players in cellular heavy metal homeostasis. In this study we investigated the properties of HvHMA1, which is a barley orthologue of Arabidopsis thaliana AtHMA1 localized to the chloroplast envelope. HvHMA1 was localized to the periphery of chloroplast of leaves and in intracellular compartments of grain aleurone cells. HvHMA1 expression was significantly higher in grains compared to leaves. In leaves, HvHMA1 expression was moderately induced by Zn deficiency, but reduced by toxic levels of Zn, Cu and Cd. Isolated barley chloroplasts exported Zn and Cu when supplied with Mg-ATP and this transport was inhibited by the AtHMA1 inhibitor thapsigargin. Down-regulation of HvHMA1 by RNA interference did not have an effect on foliar Zn and Cu contents but resulted in a significant increase in grain Zn and Cu content. Heterologous expression of HvHMA1 in heavy metal-sensitive yeast strains increased their sensitivity to Zn, but also to Cu, Co, Cd, Ca, Mn, and Fe. Based on these results, we suggest that HvHMA1 is a broad-specificity exporter of metals from chloroplasts and serve as a scavenging mechanism for mobilizing plastid Zn and Cu when cells become deficient in these elements. In grains, HvHMA1 might be involved in mobilizing Zn and Cu from the aleurone cells during grain filling and germination. PMID:23155447

  1. CFDP for Interplanetary Overlay Network

    NASA Technical Reports Server (NTRS)

    Burleigh, Scott C.

    2011-01-01

    The CCSDS (Consultative Committee for Space Data Systems) File Delivery Protocol for Interplanetary Overlay Network (CFDP-ION) is an implementation of CFDP that uses IO' s DTN (delay tolerant networking) implementation as its UT (unit-data transfer) layer. Because the DTN protocols effect automatic, reliable transmission via multiple relays, CFDP-ION need only satisfy the requirements for Class 1 ("unacknowledged") CFDP. This keeps the implementation small, but without loss of capability. This innovation minimizes processing resources by using zero-copy objects for file data transmission. It runs without modification in VxWorks, Linux, Solaris, and OS/X. As such, this innovation can be used without modification in both flight and ground systems. Integration with DTN enables the CFDP implementation itself to be very simple; therefore, very small. Use of ION infrastructure minimizes consumption of storage and processing resources while maximizing safety.

  2. Weld overlay cladding with iron aluminides

    SciTech Connect

    Goodwin, G.M.

    1997-12-01

    The author has established a range of compositions for these alloys within which hot cracking resistance is very good, and within which cold cracking can be avoided in many instances by careful control of welding conditions, particularly preheat and postweld heat treatment. For example, crack-free butt welds have been produced for the first time in 12-mm thick wrought Fe{sub 3}Al plate. Cold cracking, however, still remains an issue in many cases. The author has developed a commercial source for composite weld filler metals spanning a wide range of achievable aluminum levels, and are pursuing the application of these filler metals in a variety of industrial environments. Welding techniques have been developed for both the gas tungsten arc and gas metal arc processes, and preliminary work has been done to utilize the wire arc process for coating of boiler tubes. Clad specimens have been prepared for environmental testing in-house, and a number of components have been modified and placed in service in operating kraft recovery boilers. In collaboration with a commercial producer of spiral weld overlay tubing, the author is attempting to utilize the new filler metals for this novel application.

  3. A heavy metal P-type ATPase OsHMA4 prevents copper accumulation in rice grain

    PubMed Central

    Huang, Xin-Yuan; Deng, Fenglin; Yamaji, Naoki; Pinson, Shannon R.M.; Fujii-Kashino, Miho; Danku, John; Douglas, Alex; Guerinot, Mary Lou; Salt, David E.; Ma, Jian Feng

    2016-01-01

    Rice is a major source of calories and mineral nutrients for over half the world's human population. However, little is known in rice about the genetic basis of variation in accumulation of copper (Cu), an essential but potentially toxic nutrient. Here we identify OsHMA4 as the likely causal gene of a quantitative trait locus controlling Cu accumulation in rice grain. We provide evidence that OsHMA4 functions to sequester Cu into root vacuoles, limiting Cu accumulation in the grain. The difference in grain Cu accumulation is most likely attributed to a single amino acid substitution that leads to different OsHMA4 transport activity. The allele associated with low grain Cu was found in 67 of the 1,367 rice accessions investigated. Identification of natural allelic variation in OsHMA4 may facilitate the development of rice varieties with grain Cu concentrations tuned to both the concentration of Cu in the soil and dietary needs. PMID:27387148

  4. A heavy metal P-type ATPase OsHMA4 prevents copper accumulation in rice grain.

    PubMed

    Huang, Xin-Yuan; Deng, Fenglin; Yamaji, Naoki; Pinson, Shannon R M; Fujii-Kashino, Miho; Danku, John; Douglas, Alex; Guerinot, Mary Lou; Salt, David E; Ma, Jian Feng

    2016-01-01

    Rice is a major source of calories and mineral nutrients for over half the world's human population. However, little is known in rice about the genetic basis of variation in accumulation of copper (Cu), an essential but potentially toxic nutrient. Here we identify OsHMA4 as the likely causal gene of a quantitative trait locus controlling Cu accumulation in rice grain. We provide evidence that OsHMA4 functions to sequester Cu into root vacuoles, limiting Cu accumulation in the grain. The difference in grain Cu accumulation is most likely attributed to a single amino acid substitution that leads to different OsHMA4 transport activity. The allele associated with low grain Cu was found in 67 of the 1,367 rice accessions investigated. Identification of natural allelic variation in OsHMA4 may facilitate the development of rice varieties with grain Cu concentrations tuned to both the concentration of Cu in the soil and dietary needs. PMID:27387148

  5. Device overlay method for high volume manufacturing

    NASA Astrophysics Data System (ADS)

    Lee, Honggoo; Han, Sangjun; Kim, Youngsik; Kim, Myoungsoo; Heo, Hoyoung; Jeon, Sanghuck; Choi, DongSub; Nabeth, Jeremy; Brinster, Irina; Pierson, Bill; Robinson, John C.

    2016-03-01

    Advancing technology nodes with smaller process margins require improved photolithography overlay control. Overlay control at develop inspection (DI) based on optical metrology targets is well established in semiconductor manufacturing. Advances in target design and metrology technology have enabled significant improvements in overlay precision and accuracy. One approach to represent in-die on-device as-etched overlay is to measure at final inspection (FI) with a scanning electron microscope (SEM). Disadvantages to this approach include inability to rework, limited layer coverage due to lack of transparency, and higher cost of ownership (CoO). A hybrid approach is investigated in this report whereby infrequent DI/FI bias is characterized and the results are used to compensate the frequent DI overlay results. The bias characterization is done on an infrequent basis, either based on time or triggered from change points. On a per-device and per-layer basis, the optical target overlay at DI is compared with SEM on-device overlay at FI. The bias characterization results are validated and tracked for use in compensating the DI APC controller. Results of the DI/FI bias characterization and sources of variation are presented, as well as the impact on the DI correctables feeding the APC system. Implementation details in a high volume manufacturing (HVM) wafer fab will be reviewed. Finally future directions of the investigation will be discussed.

  6. A member of the heavy metal P-type ATPase OsHMA5 is involved in xylem loading of copper in rice.

    PubMed

    Deng, Fenglin; Yamaji, Naoki; Xia, Jixing; Ma, Jian Feng

    2013-11-01

    Heavy metal-transporting P-type ATPase (HMA) has been implicated in the transport of heavy metals in plants. Here, we report the function and role of an uncharacterized member of HMA, OsHMA5 in rice (Oryza sativa). Knockout of OsHMA5 resulted in a decreased copper (Cu) concentration in the shoots but an increased Cu concentration in the roots at the vegetative stage. At the reproductive stage, the concentration of Cu in the brown rice was significantly lower in the mutants than in the wild-type rice; however, there was no difference in the concentrations of iron, manganese, and zinc between two independent mutants and the wild type. The Cu concentration of xylem sap was lower in the mutants than in the wild-type rice. OsHMA5 was mainly expressed in the roots at the vegetative stage but also in nodes, peduncle, rachis, and husk at the reproductive stage. The expression was up-regulated by excess Cu but not by the deficiency of Cu and other metals, including zinc, iron, and manganese, at the vegetative stage. Analysis of the transgenic rice carrying the OsHMA5 promoter fused with green fluorescent protein revealed that it was localized at the root pericycle cells and xylem region of diffuse vascular bundles in node I, vascular tissues of peduncle, rachis, and husk. Furthermore, immunostaining with an antibody against OsHMA5 revealed that it was localized to the plasma membrane. Expression of OsHMA5 in a Cu transport-defective mutant yeast (Saccharomyces cerevisiae) strain restored the growth. Taken together, OsHMA5 is involved in loading Cu to the xylem of the roots and other organs. PMID:24064929

  7. Interacting epidemics on overlay networks

    NASA Astrophysics Data System (ADS)

    Funk, Sebastian; Jansen, Vincent A. A.

    2010-03-01

    The interaction between multiple pathogens spreading on networks connecting a given set of nodes presents an ongoing theoretical challenge. Here, we aim to understand such interactions by studying bond percolation of two different processes on overlay networks of arbitrary joint degree distribution. We find that an outbreak of a first pathogen providing immunity to another one spreading subsequently on a second network connecting the same set of nodes does so most effectively if the degrees on the two networks are positively correlated. In that case, the protection is stronger the more heterogeneous the degree distributions of the two networks are. If, on the other hand, the degrees are uncorrelated or negatively correlated, increasing heterogeneity reduces the potential of the first process to prevent the second one from reaching epidemic proportions. We generalize these results to cases where the edges of the two networks overlap to arbitrary amount, or where the immunity granted is only partial. If both processes grant immunity to each other, we find a wide range of possible situations of coexistence or mutual exclusion, depending on the joint degree distribution of the underlying networks and the amount of immunity granted mutually. These results generalize the concept of a coexistence threshold and illustrate the impact of large-scale network structure on the interaction between multiple spreading agents.

  8. IMPERMEABLE THIN AL2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2003-12-16

    To improve the hot corrosion resistance of YSZ thermal barrier coatings, a 25 {micro}m and a 2 {micro}m thick Al{sub 2}O{sub 3} overlay were deposited by HVOF thermal spray and by sol-gel coating method, respectively, onto to the surface of YSZ coating. Indenter test was employed to investigate the spalling of YSZ with and without Al{sub 2}O{sub 3} overlay after hot corrosion. The results showed that Al{sub 2}O{sub 3} overlay acted as a barrier against the infiltration of the molten salt into the YSZ coating during exposure, thus significantly reduced the amount of M-phase of ZrO{sub 2} in YSZ coating. However, a thick Al{sub 2}O{sub 3} overlay was harmful for TBC by increasing compressive stress which causes crack and spalling of YSZ coating. As a result, a dense and thin Al{sub 2}O{sub 3} overlay is critical for simultaneously preventing YSZ from hot corrosion and spalling. In the next reporting period, we will measure or calculate the residue stress within Al{sub 2}O{sub 3} overlay and YSZ coating to study the mechanism of effect of Al{sub 2}O{sub 3} overlay on spalling of YSZ coating.

  9. A moving overlay shrinks the attentional blink.

    PubMed

    Chua, Fook K

    2015-01-01

    This report describes a study examining the effects of overlaying a veil of spots on the letters in a central rapid serial visual presentation stream. Observers identified two target letters (T1 and T2, respectively) embedded in a stream of distractor letters printed in a different color. In Experiment 1, the attentional blink (AB) diminished when a different overlay veiled each letter, such that the spots appeared to move as the letters changed. Experiment 2 concerned whether the performance enhancement occurred because the overlay hampered processing of the lag 1 distractor, thus weakening the distractor's interference with T1. Experiment 3 focused on how changing the overlay at or around T1 affected the AB. The attention disengagement hypothesis was proposed to explain the common theme in the results-that performance was only enhanced when different overlays were applied to the T1 and lag 1 frames. The claim is that the AB reflects a failure of prompt attentional disengagement from T1, which, in turn, delays reengagement when T2 appears shortly thereafter. When T1's disappearance is accompanied by an overlay change, the perceptual system gets an additional cue signaling that the visual scene has changed, thereby inducing attentional disengagement. Apart from facilitating prompt reengagement at the next target, earlier disengagement also improves target recovery by excluding features of the trailing item, likely to be a distractor, from working memory. PMID:25245077

  10. Scatterometry or imaging overlay: a comparative study

    NASA Astrophysics Data System (ADS)

    Hsu, Simon C. C.; Pai, Yuan Chi; Chen, Charlie; Yu, Chun Chi; Hsing, Henry; Wu, Hsing-Chien; Kuo, Kelly T. L.; Amir, Nuriel

    2015-03-01

    Most fabrication facilities today use imaging overlay measurement methods, as it has been the industry's reliable workhorse for decades. In the last few years, third-generation Scatterometry Overlay (SCOL™) or Diffraction Based Overlay (DBO-1) technology was developed, along another DBO technology (DBO-2). This development led to the question of where the DBO technology should be implemented for overlay measurements. Scatterometry has been adopted for high volume production in only few cases, always with imaging as a backup, but scatterometry overlay is considered by many as the technology of the future. In this paper we compare imaging overlay and DBO technologies by means of measurements and simulations. We outline issues and sensitivities for both technologies, providing guidelines for the best implementation of each. For several of the presented cases, data from two different DBO technologies are compared as well, the first with Pupil data access (DBO-1) and the other without pupil data access (DBO-2). Key indicators of overlay measurement quality include: layer coverage, accuracy, TMU, process robustness and robustness to process changes. Measurement data from real cases across the industry are compared and the conclusions are also backed by simulations. Accuracy is benchmarked with reference OVL, and self-consistency, showing good results for Imaging and DBO-1 technology. Process sensitivity and metrology robustness are mostly simulated with MTD (Metrology Target Designer) comparing the same process variations for both technologies. The experimental data presented in this study was done on ten advanced node layers and three production node layers, for all phases of the IC fabrication process (FEOL, MEOL and BEOL). The metrology tool used for most of the study is KLA-Tencor's Archer 500LCM system (scatterometry-based and imaging-based measurement technologies on the same tool) another type of tool is used for DBO-2 measurements. Finally, we conclude that

  11. Polymer concrete overlay on SH-51, bridge deck

    NASA Astrophysics Data System (ADS)

    Borg, T. M.

    1982-06-01

    A thin resinous overlay was placed on a sound bridge deck in Oklahoma to evaluate its performance over one year using various physical tests. The evaluation shows how well the overlay protects the reinforcing steel from corrosion due to deicing salts. The steps leading to the construction of the overlay are detailed as well as the actual placing of the overlay. The results of various physical tests are reported for both before and after the overlay.

  12. IMPERMEABLE THIN Al2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2002-11-30

    In order to improve the hot corrosion resistance of conventional YSZ TBC system, the Al{sub 2}O{sub 3} overlay coating has been successfully produced on the surface of YSZ by the Sol-gel route. The YSZ substrates were coated with boehmite sol by dip coating process, dried to form a gel film and calcined at 1200 C to form {alpha}-Al{sub 2}O{sub 3} overlay. The microstructures of TBC and Al{sub 2}O{sub 3} overlay were examined by scanning electron microscopy (SEM). The results showed that micro-pores ranged from 3 {micro}m to 20 {micro}m and micro-cracks could be clearly seen on the surface of APS YSZ coating. The thickness of alumina overlay increased with increasing the number of dip coating circles. The small microcracks (0.5-1.0 {micro}m width) on the YSZ surface could be filled and blocked by calcined alumina particles, whereas large pores remained empty and the alumina overlay was un-continuous after one time dip coating circle. Alumina overlay thicker than 5 m m obtained by five times dip coating circles largely cracked after calcinations. As a result, multiple dip coatings up to three times were ideal for getting high quality, crack- free and continuous overlay. The optimal thickness of alumina overlay was in the range of 2.5-3.5 {micro}m. In the next reporting period, we will study the hot corrosion behaviors of YSZ TBC with Al{sub 2}O{sub 3} overlay coating produced by sol gel route by exposure the samples to molten salts mixtures (Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5}) at 950 C.

  13. Epitaxial interactions between molecular overlayers and ordered substrates

    NASA Astrophysics Data System (ADS)

    Hillier, Andrew C.; Ward, Michael D.

    1996-11-01

    A framework for evaluating the epitaxy of crystalline organic overlayers of generic symmetry on ordered substrates is described, which combines a computationally efficient analytical method for explicit determination of the type of epitaxy (i.e., commensurism, coincidence, or incommensurism) and overlayer azimuthal orientation with an analysis of the elastic properties of the overlayer and the overlayer-substrate interface. The azimuthal orientations predicted by the analytical method agree with values predicted by semiempirical potential-energy calculations and observed experimentally for previously reported organic overlayers which are demonstrated here to be coincident. Calculations based on this analytical approach are much less computationally intensive than potential-energy calculations, as the number of computational operations is independent of the overlayer size chosen for analysis. This enables analyses to be performed for the large overlayer basis sets common for molecular overlayers. Furthermore, this facilitates the analysis of coincident overlayers, for which the overlayer size needs to be large enough to establish a phasing relationship between a substrate and a large nonprimitive overlayer supercell so that the global minimum with respect to azimuthal angle can be determined. The computational efficiency of this method also enables a convenient examination of numerous possible reconstructed overlayer configurations in which the lattice parameters are bracketed around those of the native overlayer, thereby allowing examination of possible epitaxy-driven overlayer reconstructions. When combined with calculated intralayer- and overlayer-substrate elastic constants, this method provides a strategy for the design of heteroepitaxial molecular films.

  14. A Major Quantitative Trait Locus for Cadmium Tolerance in Arabidopsis halleri Colocalizes with HMA4, a Gene Encoding a Heavy Metal ATPase1[OA

    PubMed Central

    Courbot, Mikael; Willems, Glenda; Motte, Patrick; Arvidsson, Samuel; Roosens, Nancy; Saumitou-Laprade, Pierre; Verbruggen, Nathalie

    2007-01-01

    Cadmium (Cd) tolerance seems to be a constitutive species-level trait in Arabidopsis halleri sp. halleri. Therefore, an interspecific cross was made between A. halleri and its closest nontolerant interfertile relative, Arabidopsis lyrata sp. petraea, and a first-generation backcross population (BC1) was used to map quantitative trait loci (QTL) for Cd tolerance. Three QTL were identified, which explained 43%, 24%, and 16% of the phenotypic variation in the mapping population. Heavy metal transporting ATPases4 (HMA4), encoding a predicted heavy metal ATPase, colocalized with the peak of the major QTL Cdtol-1 and was consequently further studied. HMA4 transcripts levels were higher in the roots and the shoots of A. halleri than in A. lyrata sp. petraea. Furthermore, HMA4 was also more highly expressed in all BC1 genotypes harboring the HMA4 A. halleri allele at the QTL Cdtol-1, independently of the presence of an A. halleri allele at the two other QTL. Overexpression of AhHMA4 in yeast (Saccharomyces cerevisiae) supported a role of HMA4 in zinc (Zn) and Cd transport by reducing the Cd and Zn contents of the yeast cells. In epidermal tobacco (Nicotiana tabacum) cells, AhHMA4:green fluorescent protein was clearly localized in the plasma membrane. Taken together, all available data point to the elevated expression of HMA4 P1B-type ATPase as an efficient mechanism for improving Cd/Zn tolerance in plants under conditions of Cd/Zn excess by maintaining low cellular Cd2+ and Zn2+ concentrations in the cytoplasm. PMID:17434989

  15. A Heavy Metal-Associated Protein (AcHMA1) from the Halophyte, Atriplex canescens (Pursh) Nutt., Confers Tolerance to Iron and Other Abiotic Stresses When Expressed in Saccharomyces cerevisiae

    PubMed Central

    Sun, Xin-Hua; Yu, Gang; Li, Jing-Tao; Jia, Pan; Zhang, Ji-Chao; Jia, Cheng-Guo; Zhang, Yan-Hua; Pan, Hong-Yu

    2014-01-01

    Many heavy metals are essential for metabolic processes, but are toxic at elevated levels. Metal tolerance proteins provide resistance to this toxicity. In this study, we identified and characterized a heavy metal-associated protein, AcHMA1, from the halophyte, Atriplex canescens. Sequence analysis has revealed that AcHMA1 contains two heavy metal binding domains. Treatments with metals (Fe, Cu, Ni, Cd or Pb), PEG6000 and NaHCO3 highly induced AcHMA1 expression in A. canescens, whereas NaCl and low temperature decreased its expression. The role of AcHMA1 in metal stress tolerance was examined using a yeast expression system. Expression of the AcHMA1 gene significantly increased the ability of yeast cells to adapt to and recover from exposure to excess iron. AcHMA1 expression also provided salt, alkaline, osmotic and oxidant stress tolerance in yeast cells. Finally, subcellular localization of an AcHMA1/GFP fusion protein expressed in tobacco cells showed that AcHMA1 was localized in the plasma membrane. Thus, our results suggest that AcHMA1 encodes a membrane-localized metal tolerance protein that mediates the detoxification of iron in eukaryotes. Furthermore, AcHMA1 also participates in the response to abiotic stress. PMID:25153638

  16. Characterization of the HMA7 gene and transcriptomic analysis of candidate genes for copper tolerance in two Silene vulgaris ecotypes.

    PubMed

    Baloun, Jiri; Nevrtalova, Eva; Kovacova, Viera; Hudzieczek, Vojtech; Cegan, Radim; Vyskot, Boris; Hobza, Roman

    2014-08-15

    Silene vulgaris possesses ecotype-specific tolerance to high levels of copper in the soil. Although this was reported a few decades ago, little is known about this trait on a molecular level. The aim of this study was to analyze the transcription response to elevated copper concentrations in two S. vulgaris ecotypes originating from copper-contrasting soil types - copper-tolerant Lubietova and copper-sensitive Stranska skala. To reveal if plants are transcriptionally affected, we first analyzed the HMA7 gene, a known key player in copper metabolism. Based on BAC library screening, we identified a BAC clone containing a SvHMA7 sequence with all the structural properties specific for plant copper-transporting ATPases. The functionality of the gene was tested using heterologous complementation in yeast mutants. Analyses of SvHMA7 transcription patterns showed that both ecotypes studied up-regulated SvHMA7 transcription after the copper treatment. Our data are supported by analysis of appropriate reference genes based on RNA-Seq databases. To identify genes specifically involved in copper response in the studied ecotypes, we analyzed transcription profiles of genes coding Cu-transporting proteins and genes involved in the prevention of copper-induced oxidative stress in both ecotypes. Our data show that three genes (APx, POD and COPT5) differ in their transcription pattern between the ecotypes with constitutively increased transcription in Lubietova. Taken together, we have identified transcription differences between metallifferous and non-metalliferous ecotypes of S. vulgaris, and we have suggested candidate genes participating in metal tolerance in this species. PMID:24973591

  17. Enhacement of intrafield overlay using a design based metrology system

    NASA Astrophysics Data System (ADS)

    Jo, Gyoyeon; Ji, Sunkeun; Kim, Shinyoung; Kang, Hyunwoo; Park, Minwoo; Kim, Sangwoo; Kim, Jungchan; Park, Chanha; Yang, Hyunjo; Maruyama, Kotaro; Park, Byungjun

    2016-03-01

    As the scales of the semiconductor devices continue to shrink, accurate measurement and control of the overlay have been emphasized for securing more overlay margin. Conventional overlay analysis methods are based on the optical measurement of the overlay mark. However, the overlay data obtained from these optical methods cannot represent the exact misregistration between two layers at the circuit level. The overlay mismatch may arise from the size or pitch difference between the overlay mark and the real pattern. Pattern distortion, caused by CMP or etching, could be a source of the overlay mismatch as well. Another issue is the overlay variation in the real circuit pattern which varies depending on its location. The optical overlay measurement methods, such as IBO and DBO that use overlay mark on the scribeline, are not capable of defining the exact overlay values of the real circuit. Therefore, the overlay values of the real circuit need to be extracted to integrate the semiconductor device properly. The circuit level overlay measurement using CDSEM is time-consuming in extracting enough data to indicate overall trend of the chip. However DBM tool is able to derive sufficient data to display overlay tendency of the real circuit region with high repeatability. An E-beam based DBM(Design Based Metrology) tool can be an alternative overlay measurement method. In this paper, we are going to certify that the overlay values extracted from optical measurement cannot represent the circuit level overlay values. We will also demonstrate the possibility to correct misregistration between two layers using the overlay data obtained from the DBM system.

  18. A loss-of-function allele of OsHMA3 associated with high cadmium accumulation in shoots and grain of Japonica rice cultivars.

    PubMed

    Yan, Jiali; Wang, Peitong; Wang, Peng; Yang, Meng; Lian, Xingming; Tang, Zhong; Huang, Chao-Feng; Salt, David E; Zhao, Fang Jie

    2016-09-01

    Excessive cadmium (Cd) accumulation in rice poses a risk to food safety. OsHMA3 plays an important role in restricting Cd translocation from roots to shoots. A non-functional allele of OsHMA3 has been reported in some Indica rice cultivars with high Cd accumulation, but it is not known if OsHMA3 allelic variation is associated with Cd accumulation in Japonica cultivars. In this study, we identified a Japonica cultivar with consistently high Cd accumulation in shoots and grain in both field and greenhouse experiments. The cultivar possesses an OsHMA3 allele with a predicted amino acid mutation at the 380(th) position from Ser to Arg. The haplotype had no Cd transport activity when the gene was expressed in yeast, and the allele did not complement a known nonfunctional allele of OsHMA3 in F1 test. The allele is present only in temperate Japonica cultivars among diversity panels of 1483 rice cultivars. Different cultivars possessing this allele showed greatly increased root-to-shoot Cd translocation and a shift in root Cd speciation from Cd-S to Cd-O bonding determined by synchrotron X-ray absorption spectroscopy. Our study has identified a new loss-of-function allele of OsHMA3 in Japonica rice cultivars leading to high Cd accumulation in shoots and grain. PMID:27038090

  19. Robotic weld overlay coatings for erosion control

    SciTech Connect

    Not Available

    1994-11-01

    The erosion of materials by the impact of solid particles has received increasing attention during the past twenty years. Recently, research has been initiated with the event of advanced coal conversion processes in which erosion plays an important role. The resulting damage, termed Solid Particle Erosion (SPE), is of concern primarily because of the significantly increased operating costs which result in material failures. Reduced power plant efficiency due to solid particle erosion of boiler tubes and waterfalls has led to various methods to combat SPE. One method is to apply coatings to the components subjected to erosive environments. Protective weld overlay coatings are particularly advantageous in terms of coating quality. The weld overlay coatings are essentially immune to spallation due to a strong metallurgical bond with the substrate material. By using powder mixtures, multiple alloys can be mixed in order to achieve the best performance in an erosive environment. However, a review of the literature revealed a lack of information on weld overlay coating performance in erosive environments which makes the selection of weld overlay alloys a difficult task. The objective of this project is to determine the effects of weld overlay coating composition and microstructure on erosion resistance. These results will lead to a better understanding of erosion mitigation in CFB`s.

  20. Solidification of an alloy 625 weld overlay

    SciTech Connect

    DuPont, J.N.

    1996-11-01

    The solidification behavior (microsegregation, secondary phase formation, and solidification temperature range) of an Alloy 625 weld overlay deposited on 2.25Cr-1Mo steel by gas metal arc welding was investigated by light and electron optical microscopy, electron microprobe, and differential thermal analysis techniques. The overlay deposit was found to terminate solidification at {approx}1,216 C by a {gamma}/Laves eutectic-type reaction. The Laves phase was highly enriched in Nb, Mo, and Si. The solidification reaction and microsegregation potential of major alloying elements in the overlay deposit are compared to other Nb-bearing Ni base alloys and found to be very similar to those for Alloy 718. Solidification cracks observed in the overlay were attributed to the wide solidification temperature range ({approx}170 C) and formation of interdendritic ({gamma} + Laves) constituent. Reasonable agreement is obtained between the calculated and measured volume percent ({gamma} + Laves) constituent with the Scheil equation by treating the overlay system as a simple {gamma}-Nb binary and using an experimentally determined k{sub Nb} value from electron microprobe data.

  1. Robotic weld overlay coatings for erosion control

    NASA Astrophysics Data System (ADS)

    The erosion of materials by the impact of solid particles has received increasing attention during the past twenty years. Recently, research has been initiated with the event of advanced coal conversion processes in which erosion plays an important role. The resulting damage, termed Solid Particle Erosion (SPE), is of concern primarily because of the significantly increased operating costs which result in material failures. Reduced power plant efficiency due to solid particle erosion of boiler tubes and waterfalls has led to various methods to combat SPE. One method is to apply coatings to the components subjected to erosive environments. Protective weld overlay coatings are particularly advantageous in terms of coating quality. The weld overlay coatings are essentially immune to spallation due to a strong metallurgical bond with the substrate material. By using powder mixtures, multiple alloys can be mixed in order to achieve the best performance in an erosive environment. However, a review of the literature revealed a lack of information on weld overlay coating performance in erosive environments which makes the selection of weld overlay alloys a difficult task. The objective of this project is to determine the effects of weld overlay coating composition and microstructure on erosion resistance. These results will lead to a better understanding of erosion mitigation in CFB's.

  2. A study of swing-curve physics in diffraction-based overlay

    NASA Astrophysics Data System (ADS)

    Bhattacharyya, Kaustuve; den Boef, Arie; Storms, Greet; van Heijst, Joost; Noot, Marc; An, Kevin; Park, Noh-Kyoung; Jeon, Se-Ra; Oh, Nang-Lyeom; McNamara, Elliott; van de Mast, Frank; Oh, SeungHwa; Lee, Seung Yoon; Hwang, Chan; Lee, Kuntack

    2016-03-01

    With the increase of process complexity in advanced nodes, the requirements of process robustness in overlay metrology continues to tighten. Especially with the introduction of newer materials in the film-stack along with typical stack variations (thickness, optical properties, profile asymmetry etc.), the signal formation physics in diffraction-based overlay (DBO) becomes an important aspect to apply in overlay metrology target and recipe selection. In order to address the signal formation physics, an effort is made towards studying the swing-curve phenomena through wavelength and polarizations on production stacks using simulations as well as experimental technique using DBO. The results provide a wealth of information on target and recipe selection for robustness. Details from simulation and measurements will be reported in this technical publication.

  3. Weld overlay coatings for erosion control

    SciTech Connect

    Levin, B.; DuPont, J.N.; Marder, A.R.

    1993-03-03

    A literature review was made. In spite of similarities between abrasive wear and solid particle erosion, weld overlay hardfacing alloys that exhibit high abrasion resistance may not necessarily have good erosion resistance. The performance of weld overlay hardfacing alloys in erosive environments has not been studied in detail. It is believed that primary-solidified hard phases such as carbides and intermetallic compounds have a strong influence on erosion resistance of weld overlay hardfacing alloys. However, relationships between size, shape, and volume fraction of hard phases in a hardfacing alloys and erosion resistance were not established. Almost all hardfacing alloys can be separated into two major groups based upon chemical compositions of the primary solidified hard phases: (a) carbide hardening alloys (Co-base/carbide, WC-Co and some Fe base superalloys); and (b) intermetallic hardening alloys (Ni-base alloys, austenitic steels, iron-aluminides).

  4. Robotic weld overlay coatings for erosion control

    SciTech Connect

    Levin, B.F.; Dupont, J.N.; Marder, A.R.

    1993-04-18

    Twelve weld overlay hardfacing alloys have been selected for preliminary erosion testing based on a literature review These alloys have been separated into three major groups: (1) Cobalt containing alloys, (2) Nickel-base alloys, (3) Iron base alloys. These alloys are being applied to carbon steel substrates and will undergo preliminary erosion testing to identify candidates weld overlay alloys for erosion control in CFB boilers. The candidate alloys selected from the preliminary erosion tests will then undergo more detailed evaluations in future research.

  5. KML Super Overlay to WMS Translator

    NASA Technical Reports Server (NTRS)

    Plesea, Lucian

    2007-01-01

    This translator is a server-based application that automatically generates KML super overlay configuration files required by Google Earth for map data access via the Open Geospatial Consortium WMS (Web Map Service) standard. The translator uses a set of URL parameters that mirror the WMS parameters as much as possible, and it also can generate a super overlay subdivision of any given area that is only loaded when needed, enabling very large areas of coverage at very high resolutions. It can make almost any dataset available as a WMS service visible and usable in any KML application, without the need to reformat the data.

  6. Ellipsometric study of ambient-produced overlayer growth rate on YBa2Cu3O(7-x) films

    NASA Technical Reports Server (NTRS)

    Sieg, Robert M.; Alterovitz, Samuel A.; Warner, Joseph D.

    1993-01-01

    An ellipsometric study of ambient-reaction-produced BaCO3 overlayer growth on laser-ablated YBCO is presented as a function of time. The effects of the anisotropy of YBCO on the ellipsometric data inversion process are discussed, and it is concluded that with certain restrictions on the data acquisition method, the anisotropic substrate can be adequately modeled by its isotropic pseudodielectric function for the purpose of overlayer thickness estimation. It is found that after an initial period of rapid growth attributed to the chemical reaction of the exposed surface bonds, the BaCO3 overlayer growth is linear at 1-2 A per day. This slow growth rate is attributed to the complexity of the BaCO3-forming reaction, together with the need for ambient reactants to diffuse through the overlayer.

  7. Hybrid overlay metrology for high order correction by using CDSEM

    NASA Astrophysics Data System (ADS)

    Leray, Philippe; Halder, Sandip; Lorusso, Gian; Baudemprez, Bart; Inoue, Osamu; Okagawa, Yutaka

    2016-03-01

    Overlay control has become one of the most critical issues for semiconductor manufacturing. Advanced lithographic scanners use high-order corrections or correction per exposure to reduce the residual overlay. It is not enough in traditional feedback of overlay measurement by using ADI wafer because overlay error depends on other process (etching process and film stress, etc.). It needs high accuracy overlay measurement by using AEI wafer. WIS (Wafer Induced Shift) is the main issue for optical overlay, IBO (Image Based Overlay) and DBO (Diffraction Based Overlay). We design dedicated SEM overlay targets for dual damascene process of N10 by i-ArF multi-patterning. The pattern is same as device-pattern locally. Optical overlay tools select segmented pattern to reduce the WIS. However segmentation has limit, especially the via-pattern, for keeping the sensitivity and accuracy. We evaluate difference between the viapattern and relaxed pitch gratings which are similar to optical overlay target at AEI. CDSEM can estimate asymmetry property of target from image of pattern edge. CDSEM can estimate asymmetry property of target from image of pattern edge. We will compare full map of SEM overlay to full map of optical overlay for high order correction ( correctables and residual fingerprints).

  8. Differential signal scatterometry overlay metrology: an accuracy investigation

    NASA Astrophysics Data System (ADS)

    Kandel, Daniel; Adel, Mike; Dinu, Berta; Golovanevsky, Boris; Izikson, Pavel; Levinski, Vladimir; Vakshtein, Irina; Leray, Philippe; Vasconi, Mauro; Salski, Bartlomiej

    2007-06-01

    The overlay control budget for the 32nm technology node will be 5.7nm according to the ITRS. The overlay metrology budget is typically 1/10 of the overlay control budget resulting in overlay metrology total measurement uncertainty (TMU) requirements of 0.57nm for the most challenging use cases of the 32nm node. The current state of the art imaging overlay metrology technology does not meet this strict requirement, and further technology development is required to bring it to this level. In this work we present results of a study of an alternative technology for overlay metrology - Differential signal scatterometry overlay (SCOL). Theoretical considerations show that overlay technology based on differential signal scatterometry has inherent advantages, which will allow it to achieve the 32nm technology node requirements and go beyond it. We present results of simulations of the expected accuracy associated with a variety of scatterometry overlay target designs. We also present our first experimental results of scatterometry overlay measurements, comparing this technology with the standard imaging overlay metrology technology. In particular, we present performance results (precision and tool induced shift) and address the issue of accuracy of scatterometry overlay. We show that with the appropriate target design and algorithms scatterometry overlay achieves the accuracy required for future technology nodes.

  9. IMPERMEABLE THIN Al2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2003-03-10

    In order to improve the hot corrosion resistance of conventional YSZ TBC system, a thin and dense {alpha}-Al{sub 2}O{sub 3} overlay has been deposited on the YSZ surface by the composite-sol-gel route (CSG). The YSZ substrates were dipped with boehmite sol containing calcined {alpha}-Al{sub 2}O{sub 3} particles, dried to form a gel film and calcined at 1200 C to form {alpha}-Al{sub 2}O{sub 3} overlay. Hot corrosion tests were carried out on the TBCs with and without Al{sub 2}O{sub 3} coating in molten salt mixtures (Na{sub 2}SO{sub 4} + 5% V{sub 2}O{sub 5}) at 950 C for 10 hours. The results showed that besides a thin and dense alumina overlay with the thickness of about 100-500 nm formed on the YSZ surface, the microcracks and porous near the surface in YSZ was also occupied by alumina because of penetration of the low viscosity precursor. As a result, the Al{sub 2}O{sub 3} overlay remarkably refrained the infiltration of the molten salt into the YSZ coating. The amount of M-phase in the TBC coating with Al{sub 2}O{sub 3} overlay was substantially reduced comparing to that without alumina overlay. In the next reporting period, we will prepare the alumina overlay by CSG route with different thickness and study the hot corrosion mechanism of YSZ TBC with thin Al{sub 2}O{sub 3} overlay coating produced by CSG.

  10. Colors, colored overlays, and reading skills

    PubMed Central

    Uccula, Arcangelo; Enna, Mauro; Mulatti, Claudio

    2014-01-01

    In this article, we are concerned with the role of colors in reading written texts. It has been argued that colored overlays applied above written texts positively influence both reading fluency and reading speed. These effects would be particularly evident for those individuals affected by the so called Meares-Irlen syndrome, i.e., who experience eyestrain and/or visual distortions – e.g., color, shape, or movement illusions – while reading. This condition would interest the 12–14% of the general population and up to the 46% of the dyslexic population. Thus, colored overlays have been largely employed as a remedy for some aspects of the difficulties in reading experienced by dyslexic individuals, as fluency and speed. Despite the wide use of colored overlays, how they exert their effects has not been made clear yet. Also, according to some researchers, the results supporting the efficacy of colored overlays as a tool for helping readers are at least controversial. Furthermore, the very nature of the Meares-Irlen syndrome has been questioned. Here we provide a concise, critical review of the literature. PMID:25120525

  11. Robotic weld overlay coatings for erosion control

    NASA Astrophysics Data System (ADS)

    Levin, B. F.; Dupont, J. N.; Marder, A. R.

    1994-01-01

    Research is being conducted to develop criteria for selecting weld overlay coatings for erosion mitigation in circulated fluidized beds. Twelve weld overlay alloys were deposited on 1018 steel substrates using plasma arc welding. Ten samples from each coating were prepared for erosion testing. All selected coatings were erosion tested at 400C and their erosion resistance and microstructure evaluated. Steady state erosion rates were similar for several weld overlay coatings (Ultimet, Inconel-625, Iron-Aluminide, 316L SS, and High Chromium Cast Iron) and were considerably lower than the remaining coating evaluated. These coatings had different base (Co, Fe, Ni-base). No correlations were found between room temperature microhardness of the weld overlay coatings and their erosion resistance at elevated temperature, although this criteria is often thought to be an indicator of erosion resistance. It was suggested that the coatings that showed similar erosion rates may have similar mechanical properties such as fracture strength, toughness and work hardening rates at this temperature. During the past quarter, Iron-Aluminide, Inconel-625, and 316L SS coatings were selected for more detailed investigations based upon the preliminary erosion test results. Microhardness tests were performed on eroded samples to determine the size of the work hardened zone and change in coatings hardness due to erosion. The work hardened zone was correlated with erosion resistance of the coatings. Additional Iron-Aluminide, Inconel-625, and 316L SS coatings were deposited on 1018 steel substrates.

  12. A Reference Implementation of the OGC CSW EO Standard for the ESA HMA-T project

    NASA Astrophysics Data System (ADS)

    Bigagli, Lorenzo; Boldrini, Enrico; Papeschi, Fabrizio; Vitale, Fabrizio

    2010-05-01

    This work was developed in the context of the ESA Heterogeneous Missions Accessibility (HMA) project, whose main objective is to involve the stakeholders, namely National space agencies, satellite or mission owners and operators, in an harmonization and standardization process of their ground segment services and related interfaces. Among HMA objectives was the specification, conformance testing, and experimentation of two Extension Packages (EPs) of the ebRIM Application Profile (AP) of the OGC Catalog Service for the Web (CSW) specification: the Earth Observation Products (EO) EP (OGC 06-131) and the Cataloguing of ISO Metadata (CIM) EP (OGC 07-038). Our contributions have included the development and deployment of Reference Implementations (RIs) for both the above specifications, and their integration with the ESA Service Support Environment (SSE). The RIs are based on the GI-cat framework, an implementation of a distributed catalog service, able to query disparate Earth and Space Science data sources (e.g. OGC Web Services, Unidata THREDDS) and to expose several standard interfaces for data discovery (e.g. OGC CSW ISO AP). Following our initial planning, the GI-cat framework has been extended in order to expose the CSW.ebRIM-CIM and CSW.ebRIM-EO interfaces, and to distribute queries to CSW.ebRIM-CIM and CSW.ebRIM-EO data sources. We expected that a mapping strategy would suffice for accommodating CIM, but this proved to be unpractical during implementation. Hence, a model extension strategy was eventually implemented for both the CIM and EO EPs, and the GI-cat federal model was enhanced in order to support the underlying ebRIM AP. This work has provided us with new insights into the different data models for geospatial data, and the technologies for their implementation. The extension is used by suitable CIM and EO profilers (front-end mediator components) and accessors (back-end mediator components), that relate ISO 19115 concepts to EO and CIM ones. Moreover

  13. Infrared differential interference contrast microscopy for overlay metrology on 3D-interconnect bonded wafers

    NASA Astrophysics Data System (ADS)

    Ku, Yi-sha; Shyu, Deh-Ming; Lin, Yeou-Sung; Cho, Chia-Hung

    2013-04-01

    Overlay metrology for stacked layers will be playing a key role in bringing 3D IC devices into manufacturing. However, such bonded wafer pairs present a metrology challenge for optical microscopy tools by the opaque nature of silicon. Using infrared microscopy, silicon wafers become transparent to the near-infrared (NIR) wavelengths of the electromagnetic spectrum, enabling metrology at the interface of bonded wafer pairs. Wafers can be bonded face to face (F2F) or face to back (F2B) which the stacking direction is dictated by how the stacks are carried in the process and functionality required. For example, Memory stacks tend to use F2B stacking enables a better managed design. Current commercial tools use single image technique for F2F bonding overlay measurement because depth of focus is sufficient to include both surfaces; and use multiple image techniques for F2B overlay measurement application for the depth of focus is no longer sufficient to include both stacked wafer surfaces. There is a need to specify the Z coordinate or stacking wafer number through the silicon when visiting measurement wafer sites. Two shown images are of the same (X, Y) but separate Z location acquired at focus position of each wafer surface containing overlay marks. Usually the top surface image is bright and clear; however, the bottom surface image is somewhat darker and noisier as an adhesive layer is used in between to bond the silicon wafers. Thus the top and bottom surface images are further processed to achieve similar brightness and noise level before merged for overlay measurement. This paper presents a special overlay measurement technique, using the infrared differential interference contrast (DIC) microscopy technique to measure the F2B wafer bonding overlay by a single shot image. A pair of thinned wafers at 50 and 150 μm thickness is bonded on top of a carrier wafer to evaluate the bonding overlay. It works on the principle of interferometry to gain information about the

  14. IMPERMEABLE THIN Al{sub 2}O{sub 3} OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2004-03-31

    To improve the hot corrosion resistance of YSZ thermal barrier coatings, a 25 {micro}m thick Al{sub 2}O{sub 3} overlay were deposited by HVOF thermal spray, respectively, onto to the surface of YSZ coating. In the next reporting period, we will measure or calculate the residue stress within Al{sub 2}O{sub 3} overlay and YSZ coating to study the mechanism of effect of Al{sub 2}O{sub 3} overlay on spalling of YSZ coating. However, due to the thermal expansion mismatch between YSZ coating and Al{sub 2}O{sub 3} overlay, such surface modification using Al{sub 2}O{sub 3} overlay might deteriorate strain tolerance of the TBC. In the present work, in order to investigate the effect of Al{sub 2}O{sub 3} overlay on residual stress developed in the samples during cooling after hot corrosion at high temperature, Finite Element method (FEM) was employed to determine the detailed stress states in the test specimens after cooling. The results showed that there is no high stress concentration at the interface between the YSZ and the bond coat for TBCs system without Al{sub 2}O{sub 3} overlay. On the other hand, the maximum compressive stress with a value of approximately, -330 MPa occurred within the Al{sub 2}O{sub 3} overlay. The maximum tensile stress in YSZ coat near the Al{sub 2}O{sub 3} overlay is in the range of 10-133 MPa. The maximum compressive stress of approximately -160 MPa occurred near the YSZ-bond coat interface. X axis stress play a dominant role in influencing the coating failure and spalling. In the next reporting period, we will study the thickness of Al{sub 2}O{sub 3} overlay on hot corrosion resistance and spalling of YSZ coating.

  15. Overlay metrology for dark hard mask process: simulation and experiment study

    NASA Astrophysics Data System (ADS)

    Shin, Jangho; Chalykh, Roman; Kang, Hyunjae; Kim, SeongSue; Lee, SukJoo; Cho, Han-Ku

    2007-03-01

    Simulation and experimental study results are reported to solve align/overlay problem in dark hard mask process in lithography. For simulation part, an in-house simulator, which is based on rigorous coupled wave analysis and Fourier optics method of high NA imaging, is used. According to the simulation and experiment study, image quality of alignment and overlay marks can be optimized by choosing hard mask and sub-film thickness carefully for a given process condition. In addition, it is important to keep the specification of film thickness uniformity within a certain limit. Simulation results are confirmed by experiment using the state of art memory process in Samsung semiconductor R&D facility.

  16. Using overlays to improve network security

    NASA Astrophysics Data System (ADS)

    Keromytis, Angelos D.; Misra, Vishal; Rubenstein, Daniel

    2002-07-01

    As we increase our dependency upon networked communication, the incentive to compromise and degrade network performance increases for those who wish to disrupt the flow of information. Attacks that lead to such compromise and degradation can come in a variety of forms, including distributed denial of service (DDoS) attacks, cutting wires, jamming transmissions, and monitoring/eavesdropping. Users can protect themselves from monitoring by applying cryptographic techniques, and the recent work has explored developing networks that react to DDoS attacks by locating the source(s) of the attack. However, there has been little work that addresses preventing the other kinds of attacks as opposed to reacting to them. Here, we discuss how network overlays can be used to complicate the job of an attacker that wishes to prevent communication. To amplify our point, we focus briefly on a study of preventing DDoS attacks by using overlays.

  17. Passivation of surface states of α-Fe2O3(0001) surface by deposition of Ga2O3 overlayers: A density functional theory study

    NASA Astrophysics Data System (ADS)

    Ulman, Kanchan; Nguyen, Manh-Thuong; Seriani, Nicola; Gebauer, Ralph

    2016-03-01

    There is a big debate in the community regarding the role of surface states of hematite in the photoelectrochemical water splitting. Experimental studies on non-catalytic overlayers passivating the hematite surface states claim a favorable reduction in the overpotential for the water splitting reaction. As a first step towards understanding the effect of these overlayers, we have studied the system Ga2O3 overlayers on hematite (0001) surfaces using first principles computations in the PBE+U framework. Our computations suggest that stoichiometric terminations of Ga2O3 overlayers are energetically more favored than the bare surface, at ambient oxygen chemical potentials. Energetics suggest that the overlayers prefer to grow via a layer-plus-island (Stranski-Krastanov) growth mode with a critical layer thickness of 1-2 layers. Thus, a complete wetting of the hematite surface by an overlayer of gallium oxide is thermodynamically favored. We establish that the effect of deposition of the Ga2O3 overlayers on the bare hematite surface is to passivate the surface states for the stoichiometric termination. For the oxygen terminated surface which is the most stable termination under photoelectrochemical conditions, the effect of deposition of the Ga2O3 overlayer is to passivate the hole-trapping surface state.

  18. Passivation of surface states of α-Fe2O3(0001) surface by deposition of Ga2O3 overlayers: A density functional theory study.

    PubMed

    Ulman, Kanchan; Nguyen, Manh-Thuong; Seriani, Nicola; Gebauer, Ralph

    2016-03-01

    There is a big debate in the community regarding the role of surface states of hematite in the photoelectrochemical water splitting. Experimental studies on non-catalytic overlayers passivating the hematite surface states claim a favorable reduction in the overpotential for the water splitting reaction. As a first step towards understanding the effect of these overlayers, we have studied the system Ga2O3 overlayers on hematite (0001) surfaces using first principles computations in the PBE+U framework. Our computations suggest that stoichiometric terminations of Ga2O3 overlayers are energetically more favored than the bare surface, at ambient oxygen chemical potentials. Energetics suggest that the overlayers prefer to grow via a layer-plus-island (Stranski-Krastanov) growth mode with a critical layer thickness of 1-2 layers. Thus, a complete wetting of the hematite surface by an overlayer of gallium oxide is thermodynamically favored. We establish that the effect of deposition of the Ga2O3 overlayers on the bare hematite surface is to passivate the surface states for the stoichiometric termination. For the oxygen terminated surface which is the most stable termination under photoelectrochemical conditions, the effect of deposition of the Ga2O3 overlayer is to passivate the hole-trapping surface state. PMID:26957170

  19. Overlay Tolerances For VLSI Using Wafer Steppers

    NASA Astrophysics Data System (ADS)

    Levinson, Harry J.; Rice, Rory

    1988-01-01

    In order for VLSI circuits to function properly, the masking layers used in the fabrication of those devices must overlay each other to within the manufacturing tolerance incorporated in the circuit design. The capabilities of the alignment tools used in the masking process determine the overlay tolerances to which circuits can be designed. It is therefore of considerable importance that these capabilities be well characterized. Underestimation of the overlay accuracy results in unnecessarily large devices, resulting in poor utilization of wafer area and possible degradation of device performance. Overestimation will result in significant yield loss because of the failure to conform to the tolerances of the design rules. The proper methodology for determining the overlay capabilities of wafer steppers, the most commonly used alignment tool for the production of VLSI circuits, is the subject of this paper. Because cost-effective manufacturing process technology has been the driving force of VLSI, the impact on productivity is a primary consideration in all discussions. Manufacturers of alignment tools advertise the capabilities of their equipment. It is notable that no manufacturer currently characterizes his aligners in a manner consistent with the requirements of producing very large integrated circuits, as will be discussed. This has resulted in the situation in which the evaluation and comparison of the capabilities of alignment tools require the attention of a lithography specialist. Unfortunately, lithographic capabilities must be known by many other people, particularly the circuit designers and the managers responsible for the financial consequences of the high prices of modern alignment tools. All too frequently, the designer or manager is confronted with contradictory data, one set coming from his lithography specialist, and the other coming from a sales representative of an equipment manufacturer. Since the latter generally attempts to make his

  20. Media delivery and media service overlays

    NASA Astrophysics Data System (ADS)

    Wee, Susie

    2005-03-01

    Multimedia communication and streaming media services will become mainstream network infrastructure applications in the coming decade. However, there are many challenges that must be overcome. These challenges include the Internet"s limited ability to handle real-time, low-latency media streams, the need for media security, and an uncertainty of the killer app. The nature of these challenges lends itself to enabling technology innovations in the media delivery and media processing space. Specifically, we envision an overlay infrastructure that supports networked media services that couple media delivery with in-network media processing. The media overlay should be programmable to allow rapid deployment of new applications and services and manageable so as to support the evolving requirements of the resulting usage models. Furthermore, the media overlay should allow for the delivery of protected media content for applications that have security requirements. A properly architected infrastructure can enable real-time multimedia communication and streaming media services in light of the inherent challenges.

  1. IMPERMEABLE THIN Al{sub 2}O{sub 3} OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2003-12-16

    To improve the hot corrosion resistance of YSZ thermal barrier coatings, a 25 {micro}m and a 2 {micro}m thick Al{sub 2}O{sub 3} overlay were deposited by HVOF thermal spray and by sol-gel coating method, respectively, onto to the surface of YSZ coating. Indenter test was employed to investigate the spalling of YSZ with and without Al{sub 2}O{sub 3} overlay after hot corrosion. The results showed that Al{sub 2}O{sub 3} overlay acted as a barrier against the infiltration of the molten salt into the YSZ coating during exposure, thus significantly reduced the amount of M-phase of ZrO{sub 2} in YSZ coating. However, a thick Al{sub 2}O{sub 3} overlay was harmful for TBC by increasing compressive stress which causes crack and spalling of YSZ coating. As a result, a dense and thin Al{sub 2}O{sub 3} overlay is critical for simultaneously preventing YSZ from hot corrosion and spalling. In the next reporting period, we will measure or calculate the residue stress within Al{sub 2}O{sub 3} overlay and YSZ coating to study the mechanism of effect of Al{sub 2}O{sub 3} overlay on spalling of YSZ coating.

  2. Alteration of leaf shape, improved metal tolerance, and productivity of seed by overexpression of CsHMA3 in Camelina sativa

    PubMed Central

    2014-01-01

    Background Camelina sativa (L.) Crantz, known by such popular names as “gold-of-pleasure” and “false flax,” is an alternative oilseed crop for biofuel production and can be grown in harsh environments. Considerable interest is now being given to the new concept of the development of a fusion plant which can be used as a soil remediation plant for ground contaminated by heavy metals as well as a bioenergy crop. However, knowledge of the transport processes for heavy metals across Camelina plant membranes is still rudimentary. Results Firstly, to investigate whether Camelina HMA (heavy metal P1B-ATPase) genes could be used in such a plant, we analyzed the expression patterns of eight HMA genes in Camelina (taken from the root, leaf, stem, flower, and silique). CsHMA3 genes were expressed in all organs. In addition, CsHMA3 was induced in roots and leaves especially after Pb treatment. Heterogeneous expression of CsHMA3 complemented the Pb- or Zn-sensitive phenotype of Δycf1 or Δzrc1 yeast mutant strains. Subsequently, we cloned and overexpressed CsHMA3 in Camelina. The root growth of transgenic lines was better than that in the wild-type plant under heavy metal stress (for Cd, Pb, and Zn). In particular, the transgenic lines showed enhanced Pb tolerance in a wide range of Pb concentrations. Furthermore, the Pb and Zn content in the shoots of the transgenic lines were higher than those in the wild-type plant. These results suggest that overexpression of CsHMA3 might enhance Pb and Zn tolerance and translocation. Also, the transgenic lines displayed a wider leaf shape compared with the wild-type plant due to an induction of genes related to leaf width growth and showed a greater total seed yield compared to the wild type under heavy metal stress. Conclusions Our data obtained from physiological and functional analyses using CsHMA3 overexpression plants will be useful to develop a multifunctional plant that can improve the productivity of a bioenergy crop and

  3. Impermeable thin AI2O3 overlay for TBC protection from sulfate and vanadate attack in gas turbines

    SciTech Connect

    Scott X. Mao

    2005-01-31

    25 {micro}m and a 2 {micro}m thick Al{sub 2}O{sub 3} overlay were deposited by HVOF thermal spray and by sol-gel coating method, respectively, onto to the surface of YSZ coating. Indenter test was employed to investigate the spalling of YSZ with and without Al{sub 2}O{sub 3} overlay after hot corrosion. The results showed that Al{sub 2}O{sub 3} overlay acted as a barrier against the infiltration of the molten salt into the YSZ coating during exposure, thus significantly reduced the amount of M-phase of ZrO{sub 2} in YSZ coating. Thick Al{sub 2}O{sub 3} overlay will increase compressive stress and failure in TBC. During next reporting time, Al{sub 2}O{sub 3} overlay will be deposited on the YSZ surface by the composite-sol-gel route (CSG). Hot corrosion tests will be carried out on the TBC.

  4. A nanometric Rh overlayer on a metal foil surface as a highly efficient three-way catalyst.

    PubMed

    Misumi, Satoshi; Yoshida, Hiroshi; Hinokuma, Satoshi; Sato, Tetsuya; Machida, Masato

    2016-01-01

    Pulsed arc-plasma (AP) deposition of an Rh overlayer on an Fe-Cr-Al stainless steel foil produced a composite material that exhibited high activity for automotive three-way catalysis (TWC). The AP pulses deposited metallic Rh nanoparticles 1-3 nm in size, whose density on the surface increased with the number of pulses. This led to coalescence and grain growth on the foil surface and the eventual formation of a uniform two-dimensional Rh overlayer. Full coverage of the 51 μm-thick flat foil by a 3.2 nm-thick Rh overlayer was achieved after 1,000 pulses. A simulated TWC reaction using a miniature honeycomb fabricated using flat and corrugated foils with the Rh overlayers exhibited successful light-off at a practical gaseous hourly space velocity of 1.2 × 10(5) h(-1). The turnover frequency for the NO-CO reaction over the metallic honeycomb catalyst was ca. 80-fold greater than that achieved with a reference Rh/ZrO2-coated cordierite honeycomb prepared using a conventional wet impregnation and slurry coating procedure. Despite the nonporosity and low surface area of the foil-supported Rh overlayer compared with conventional powder catalysts (Rh/ZrO2), it is a promising alternative design for more efficient automotive catalysts that use less Rh loading. PMID:27388976

  5. A nanometric Rh overlayer on a metal foil surface as a highly efficient three-way catalyst

    NASA Astrophysics Data System (ADS)

    Misumi, Satoshi; Yoshida, Hiroshi; Hinokuma, Satoshi; Sato, Tetsuya; Machida, Masato

    2016-07-01

    Pulsed arc-plasma (AP) deposition of an Rh overlayer on an Fe–Cr–Al stainless steel foil produced a composite material that exhibited high activity for automotive three-way catalysis (TWC). The AP pulses deposited metallic Rh nanoparticles 1–3 nm in size, whose density on the surface increased with the number of pulses. This led to coalescence and grain growth on the foil surface and the eventual formation of a uniform two-dimensional Rh overlayer. Full coverage of the 51 μm-thick flat foil by a 3.2 nm-thick Rh overlayer was achieved after 1,000 pulses. A simulated TWC reaction using a miniature honeycomb fabricated using flat and corrugated foils with the Rh overlayers exhibited successful light-off at a practical gaseous hourly space velocity of 1.2 × 105 h‑1. The turnover frequency for the NO–CO reaction over the metallic honeycomb catalyst was ca. 80-fold greater than that achieved with a reference Rh/ZrO2-coated cordierite honeycomb prepared using a conventional wet impregnation and slurry coating procedure. Despite the nonporosity and low surface area of the foil-supported Rh overlayer compared with conventional powder catalysts (Rh/ZrO2), it is a promising alternative design for more efficient automotive catalysts that use less Rh loading.

  6. A nanometric Rh overlayer on a metal foil surface as a highly efficient three-way catalyst

    PubMed Central

    Misumi, Satoshi; Yoshida, Hiroshi; Hinokuma, Satoshi; Sato, Tetsuya; Machida, Masato

    2016-01-01

    Pulsed arc-plasma (AP) deposition of an Rh overlayer on an Fe–Cr–Al stainless steel foil produced a composite material that exhibited high activity for automotive three-way catalysis (TWC). The AP pulses deposited metallic Rh nanoparticles 1–3 nm in size, whose density on the surface increased with the number of pulses. This led to coalescence and grain growth on the foil surface and the eventual formation of a uniform two-dimensional Rh overlayer. Full coverage of the 51 μm-thick flat foil by a 3.2 nm-thick Rh overlayer was achieved after 1,000 pulses. A simulated TWC reaction using a miniature honeycomb fabricated using flat and corrugated foils with the Rh overlayers exhibited successful light-off at a practical gaseous hourly space velocity of 1.2 × 105 h−1. The turnover frequency for the NO–CO reaction over the metallic honeycomb catalyst was ca. 80-fold greater than that achieved with a reference Rh/ZrO2-coated cordierite honeycomb prepared using a conventional wet impregnation and slurry coating procedure. Despite the nonporosity and low surface area of the foil-supported Rh overlayer compared with conventional powder catalysts (Rh/ZrO2), it is a promising alternative design for more efficient automotive catalysts that use less Rh loading. PMID:27388976

  7. Overlay improvement by ASML HOWA 5th alignment strategy

    NASA Astrophysics Data System (ADS)

    Wang, Raf; Chiang, CY; Hsu, Wilson; Yang, Richer; Shih, Todd; Chen, Jackie; Chiu, Jonathan; Lin, Wythe

    2009-12-01

    Overlay control is more challenging when DRAM volume production continues to shrink its critical dimention (CD) to 70nm and beyond. Effected by process, the overlay behavior at wafer edge is quite different from wafer center. The big contribution to worse overlay at wafer edge which causes yield loss is misalignment. The analysis in wafer edge suggests that high order uncorrectable overlay residuals are often observed by certain process impact. Therefore, the basic linear model used for alignment correction is not sufficient and it is necessary to introduce an advanced alignment correction model for wafer edge overlay improvement. In this study, we demonstrated the achievement of moderating the poor overlay at wafer edge area by using a high order wafer alignment strategy. The mechanism is to use non-linear correction methods of high order models ( up to 5th order), with support by the function High Order Wafer Alignment (known as HOWA) in scanner. Instead of linear model for the 6 overlay parameters which come from average result, HOWA alignment strategy can do high order fitting through the wafer to get more accurate overlay parameters which represent the local wafer grid distortion better. As a result, the overlay improvement for wafer edge is achieved. Since alignment is a wafer dependent correction, with HOWA the wafer to wafer overlay variation can be improved dynamically as well. In addition, the effects of different mark quantity and sampling distribution from HOWA are also introduced in this paper. The results of this study indicate that HOWA can reduce uncorrectable overlay residual by 30~40% and improve wafer-to-wafer overlay variation significantly. We conclude that HOWA is a noteworthy strategy for overlay improvement. Moreover, optimized alignment mark numbers and distribution layout are also key factors to make HOWA successful.

  8. IMPERMEABLE THIN AL2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2004-08-31

    To improve the hot corrosion resistance of YSZ thermal barrier coatings, a 25 {micro}m and a 2 {micro}m thick Al{sub 2}O{sub 3} overlay were deposited by HVOF thermal spray onto to the surface of YSZ coating. Oxidation at high temperature and hot corrosion tests showed that Al{sub 2}O{sub 3} overlay deposited on the YSZ TBCs surface can not only reduce the hot corrosion rate, but also significantly prevents the bond coat from oxidation.

  9. Experimental AC (Asphalt Concrete) overlays of PCC pavement

    NASA Astrophysics Data System (ADS)

    Smith, R. D.

    1983-11-01

    A series of experimental asphalt concrete (AC) overlays was constructed over an existing distressed portland cement concrete pavement on Interstate 80 near Boca, California. The experimental overlays included rubberized dense-graded AC, rubberized open-graded AC, a rubber flush coat interlayer, dense-graded AC with short polyester fibers and Bituthene interlayer strips. The report presents a description and discussion of AC mix batching, construction observations, laboratory testing, overlay covering, and initial performance evaluation.

  10. Highly corrosion resistant weld overlay for oil patch applications

    SciTech Connect

    Hibner, E.L.; Maligas, M.N.; Vicic, J.C.

    1994-12-31

    Petroleum equipment companies currently sell 4130 and 4140 steel pipe with alloy 625 (UNS N06625) weld overlay for Oil Patch applications. Alloy 686 (UNS N06686), because of it`s superior corrosion resistance, is currently being evaluated as a replacement material for alloy 625. Mechanical properties and Slow Strain Rate test results for the alloy 686 weld overlay are discussed relative to the alloy 625 weld overlay.

  11. Estimation of in-situ density and moisture content in HMA pavements based on GPR trace reflection amplitude using different frequencies

    NASA Astrophysics Data System (ADS)

    Plati, Christina; Loizos, Andreas

    2013-10-01

    The basic goal of the present research is to investigate the estimation of both the in-situ density and moisture content within the Hot Mix Asphalt (HMA) pavement layer(s) in a non-destructive way using Ground Penetrating Radar (GPR) trace reflection amplitude. For this purpose, an extensive pavement survey was conducted using an air-coupled GPR system, operating at 1 GHz or alternatively with a 2 GHz central frequency. The collected data were analyzed comparatively for the two antennae. The variability of electric permittivity caused by variations in HMA material is discussed, while the effect of the different frequencies is compared on the ability to retrieve permittivity, in-situ density and moisture content of the compacted HMA material using relationships suggested in reviewed international literature. The main finding of the present research is that for the same type of HMA material, the assessment of the material properties appears to be independent from the two central frequencies of investigation. However, there is evidence concerning the variations between the GPR wave data for the two different frequencies. The

  12. Stable symbionts across the HMA-LMA dichotomy: low seasonal and interannual variation in sponge-associated bacteria from taxonomically diverse hosts.

    PubMed

    Erwin, Patrick M; Coma, Rafel; López-Sendino, Paula; Serrano, Eduard; Ribes, Marta

    2015-10-01

    Marine sponges host bacterial communities with important ecological and economic roles in nature and society, yet these benefits depend largely on the stability of host-symbiont interactions and their susceptibility to changing environmental conditions. Here, we investigated the temporal stability of complex host-microbe symbioses in a temperate, seasonal environment over three years, targeting sponges across a range of symbiont density (high and low microbial abundance, HMA and LMA) and host taxonomy (six orders). Symbiont profiling by terminal restriction fragment length polymorphism analysis of 16S rRNA gene sequences revealed that bacterial communities in all sponges exhibited a high degree of host specificity, low seasonal dynamics and low interannual variability: results that represent an emerging trend in the field of sponge microbiology and contrast sharply with the seasonal dynamics of free-living bacterioplankton. Further, HMA sponges hosted more diverse, even and similar symbiont communities than LMA sponges and these differences in community structure extended to core members of the microbiome. Together, these findings show clear distinctions in symbiont structure between HMA and LMA sponges while resolving notable similarities in their stability over seasonal and inter-annual scales, thus providing insight into the ecological consequences of the HMA-LMA dichotomy and the temporal stability of complex host-microbe symbioses. PMID:26405300

  13. Metal binding to the N-terminal cytoplasmic domain of the PIB ATPase HMA4 is required for metal transport in Arabidopsis.

    PubMed

    Laurent, Clémentine; Lekeux, Gilles; Ukuwela, Ashwinie A; Xiao, Zhiguang; Charlier, Jean-Benoit; Bosman, Bernard; Carnol, Monique; Motte, Patrick; Damblon, Christian; Galleni, Moreno; Hanikenne, Marc

    2016-03-01

    PIB ATPases are metal cation pumps that transport metals across membranes. These proteins possess N- and C-terminal cytoplasmic extensions that contain Cys- and His-rich high affinity metal binding domains, which may be involved in metal sensing, metal ion selectivity and/or in regulation of the pump activity. The PIB ATPase HMA4 (Heavy Metal ATPase 4) plays a central role in metal homeostasis in Arabidopsis thaliana and has a key function in zinc and cadmium hypertolerance and hyperaccumulation in the extremophile plant species Arabidopsis halleri. Here, we examined the function and structure of the N-terminal cytoplasmic metal-binding domain of HMA4. We mutagenized a conserved CCTSE metal-binding motif in the domain and assessed the impact of the mutations on protein function and localization in planta, on metal-binding properties in vitro and on protein structure by Nuclear Magnetic Resonance spectroscopy. The two Cys residues of the motif are essential for the function, but not for localization, of HMA4 in planta, whereas the Glu residue is important but not essential. These residues also determine zinc coordination and affinity. Zinc binding to the N-terminal domain is thus crucial for HMA4 protein function, whereas it is not required to maintain the protein structure. Altogether, combining in vivo and in vitro approaches in our study provides insights towards the molecular understanding of metal transport and specificity of metal P-type ATPases. PMID:26797794

  14. Modeling thin film, buckle-driven delamination along a metal/polymer interface in a stressed overlayer test.

    SciTech Connect

    Moody, Neville Reid; Corona, Edmundo; Reedy, Earl David, Jr.

    2010-11-01

    Interfacial delamination is often the critical failure mode limiting the performance of polymer/metal interfaces. Consequently methods that measure the toughness of such interfaces are of considerable interest. One approach for measuring the toughness of a polymer/metal interface is to use the stressed-overlayer test. In this test a metal substrate is coated with a sub-micron thick polymer film to create the interface of interest. An overlayer, typically a few tenths of a micron of sputtered tungsten, is then deposited on top of the polymer in such a way as to generate a very high residual compressive stress within the sputtered layer ({approx} 1-2 GPa). This highly stressed overlayer induces delamination and blister formation. The measured buckle heights and widths are then used in conjunction with a fracture mechanics analysis to infer interfacial toughness. Here we use a finite element, cohesive-zone-based, fracture analysis to perform the required interfacial crack growth simulation. This analysis shows that calculated crack growth is sensitive to the polymer layer thickness even when the layer is only 10's of nanometers thick. The inward displacement of the overlayer at the buckle edge, which is enabled by the relatively low polymer compliance, is the primary cause of differences from a rigid substrate idealization.

  15. Sampling for advanced overlay process control

    NASA Astrophysics Data System (ADS)

    Choi, DongSub; Izikson, Pavel; Sutherland, Doug; Sherman, Kara; Manka, Jim; Robinson, John C.

    2008-03-01

    Overlay metrology and control have been critical for successful advanced microlithography for many years, and are taking on an even more important role as time goes on. Due to throughput constraints it is necessary to sample only a small subset of overlay metrology marks, and typical sample plans are static over time. Standard production monitoring and control involves measuring sufficient samples to calculate up to 6 linear correctables. As design rules shrink and processing becomes more complex, however, it is necessary to consider higher order modeled terms for control, fault detection, and disposition. This in turn, requires a higher level of sampling. Due to throughput concerns, however, careful consideration is needed to establish a base-line sampling, and higher levels of sampling can be considered on an exception-basis based on automated trigger mechanisms. The goal is improved scanner control and lithographic cost of ownership. This study addresses tools for establishing baseline sampling as well as motivation and initial results for dynamic sampling for application to higher order modeling.

  16. Sampling for advanced overlay process control

    NASA Astrophysics Data System (ADS)

    Kato, Cindy; Kurita, Hiroyuki; Izikson, Pavel; Robinson, John C.

    2009-03-01

    Overlay metrology and control have been critical for successful advanced microlithography for many years, and are taking on an even more important role as time goes on. Due to throughput constraints it is necessary to sample only a small subset of overlay metrology marks, and typical sample plans are static over time. Standard production monitoring and control involves measuring sufficient samples to calculate up to 6 linear correctables. As design rules shrink and processing becomes more complex, however, it is necessary to consider higher order models with additional degrees of freedom for control, fault detection, and disposition. This in turn, requires a higher level of sampling and a careful consideration of flyer removal. Due to throughput concerns, however, careful consideration is needed to establish a baseline sampling plan using rigorous statistical methods. This study focuses on establishing a 3x nm node immersion lithography production-worthy sampling plan for 3rd order modeling, verification of the accuracy, and proof of robustness of the sampling. In addition we discuss motivation for dynamic sampling for application to higher order modeling.

  17. Investigation of Iron Aluminide Weld Overlays

    SciTech Connect

    Banovic, S.W.; DuPont, J.B.; Levin, B.F.; Marder, A.R.

    1999-08-02

    Conventional fossil fired boilers have been retrofitted with low NO(sub)x burners in order for the power plants to comply with new clean air regulations. Due to the operating characteristics of these burners, boiler tube sulfidation corrosion typically has been enhanced resulting in premature tube failure. To protect the existing panels from accelerated attack, weld overlay coatings are typically being applied. By depositing an alloy that offers better corrosion resistance than the underlying tube material, the wastage rates can be reduced. While Ni-based and stainless steel compositions are presently providing protection, they are expensive and susceptible to failure via corrosion-fatigue due to microsegregation upon solidification. Another material system presently under consideration for use as a coating in the oxidation/sulfidation environments is iron-aluminum. These alloys are relatively inexpensive, exhibit little microsegregation, and show excellent corrosion resistance. However, their use is limited due to weldability issues and their lack of corrosion characterization in simulated low NO(sub)x gas compositions. Therefore a program was initiated in 1996 to evaluate the use of iron-aluminum weld overlay coatings for erosion/corrosion protection of boiler tubes in fossil fired boilers with low NO(sub)x burners. Investigated properties included weldability, corrosion behavior, erosion resistance, and erosion-corrosion performance.

  18. Real cell overlay measurement through design based metrology

    NASA Astrophysics Data System (ADS)

    Yoo, Gyun; Kim, Jungchan; Park, Chanha; Lee, Taehyeong; Ji, Sunkeun; Jo, Gyoyeon; Yang, Hyunjo; Yim, Donggyu; Yamamoto, Masahiro; Maruyama, Kotaro; Park, Byungjun

    2014-04-01

    Until recent device nodes, lithography has been struggling to improve its resolution limit. Even though next generation lithography technology is now facing various difficulties, several innovative resolution enhancement technologies, based on 193nm wavelength, were introduced and implemented to keep the trend of device scaling. Scanner makers keep developing state-of-the-art exposure system which guarantees higher productivity and meets a more aggressive overlay specification. "The scaling reduction of the overlay error has been a simple matter of the capability of exposure tools. However, it is clear that the scanner contributions may no longer be the majority component in total overlay performance. The ability to control correctable overlay components is paramount to achieve the desired performance.(2)" In a manufacturing fab, the overlay error, determined by a conventional overlay measurement: by using an overlay mark based on IBO and DBO, often does not represent the physical placement error in the cell area of a memory device. The mismatch may arise from the size or pitch difference between the overlay mark and the cell pattern. Pattern distortion, caused by etching or CMP, also can be a source of the mismatch. Therefore, the requirement of a direct overlay measurement in the cell pattern gradually increases in the manufacturing field, and also in the development level. In order to overcome the mismatch between conventional overlay measurement and the real placement error of layer to layer in the cell area of a memory device, we suggest an alternative overlay measurement method utilizing by design, based metrology tool. A basic concept of this method is shown in figure1. A CD-SEM measurement of the overlay error between layer 1 and 2 could be the ideal method but it takes too long time to extract a lot of data from wafer level. An E-beam based DBM tool provides high speed to cover the whole wafer with high repeatability. It is enabled by using the design as a

  19. A map overlay error model based on boundary geometry

    USGS Publications Warehouse

    Gaeuman, D.; Symanzik, J.; Schmidt, J.C.

    2005-01-01

    An error model for quantifying the magnitudes and variability of errors generated in the areas of polygons during spatial overlay of vector geographic information system layers is presented. Numerical simulation of polygon boundary displacements was used to propagate coordinate errors to spatial overlays. The model departs from most previous error models in that it incorporates spatial dependence of coordinate errors at the scale of the boundary segment. It can be readily adapted to match the scale of error-boundary interactions responsible for error generation on a given overlay. The area of error generated by overlay depends on the sinuosity of polygon boundaries, as well as the magnitude of the coordinate errors on the input layers. Asymmetry in boundary shape has relatively little effect on error generation. Overlay errors are affected by real differences in boundary positions on the input layers, as well as errors in the boundary positions. Real differences between input layers tend to compensate for much of the error generated by coordinate errors. Thus, the area of change measured on an overlay layer produced by the XOR overlay operation will be more accurate if the area of real change depicted on the overlay is large. The model presented here considers these interactions, making it especially useful for estimating errors studies of landscape change over time. ?? 2005 The Ohio State University.

  20. Overlay measurement accuracy enhancement by design and algorithm

    NASA Astrophysics Data System (ADS)

    Lee, Honggoo; Lee, Byongseog; Han, Sangjun; Kim, Myoungsoo; Kwon, Wontaik; Park, Sungki; Choi, DongSub; Lee, Dohwa; Jeon, Sanghuck; Lee, Kangsan; Itzkovich, Tal; Amir, Nuriel; Volkovich, Roie; Herzel, Eitan; Wagner, Mark; El Kodadi, Mohamed

    2015-03-01

    Advanced design nodes require more complex lithography techniques, such as double patterning, as well as advanced materials like hard masks. This poses new challenge for overlay metrology and process control. In this publication several step are taken to face these challenges. Accurate overlay metrology solutions are demonstrated for advanced memory devices.

  1. Weld overlay cladding with iron aluminides

    SciTech Connect

    Goodwin, G.M.

    1995-08-01

    The hot and cold cracking tendencies of some early iron aluminide alloy compositions have limited their use in applications where good weldability is required. Using hot crack testing techniques invented at ORNL, and experimental determinations of preheat and postweld heat treatment needed to avoid cold cracking, we have developed iron aluminide filler metal compositions which can be successfully used to weld overlay clad various substrate materials, including 9Cr-1Mo steel, 2-1/4Cr-1Mo steel, and 300-series austenitic stainless steels. Dilution must be carefully controlled to avoid crack-sensitive deposit compositions. The technique used to produce the current filler metal compositions is aspiration-casting, i.e. drawing the liquid from the melt into glass rods. Future development efforts will involve fabrication of composite wires of similar compositions to permit mechanized gas tungsten arc (GTA) and/or gas metal arc (GMA) welding.

  2. Improving text recognition by distinguishing scene and overlay text

    NASA Astrophysics Data System (ADS)

    Quehl, Bernhard; Yang, Haojin; Sack, Harald

    2015-02-01

    Video texts are closely related to the content of a video. They provide a valuable source for indexing and interpretation of video data. Text detection and recognition task in images or videos typically distinguished between overlay and scene text. Overlay text is artificially superimposed on the image at the time of editing and scene text is text captured by the recording system. Typically, OCR systems are specialized on one kind of text type. However, in video images both types of text can be found. In this paper, we propose a method to automatically distinguish between overlay and scene text to dynamically control and optimize post processing steps following text detection. Based on a feature combination a Support Vector Machine (SVM) is trained to classify scene and overlay text. We show how this distinction in overlay and scene text improves the word recognition rate. Accuracy of the proposed methods has been evaluated by using publicly available test data sets.

  3. Weld overlay cladding with iron aluminides

    SciTech Connect

    Goodwin, G.M.

    1996-11-01

    The hot and cold cracking tendencies of some early iron aluminide alloy compositions limited their use to applications where good weldability was not required. Considerable progress has been made toward improving this situation. Using hot crack testing techniques developed at ORNL and a systematic study of alloy compositional effects, we have established a range of compositions within which hot cracking resistance is very good, essentially equivalent to stainless steel. Cold cracking, however, remains an issue, and extensive efforts are continuing to optimize composition and welding parameters, especially preheat and postweld heat treatment, to minimize its occurrence. In terms of filler metal and process development, we have progressed from sheared strip through aspiration cast rod and shielded metal arc electrodes to the point where we can now produce composite wire with a steel sheath and aluminum core in coil form, which permits the use of both the gas tungsten arc and gas metal arc processes. This is a significant advancement in that the gas metal arc process lends itself well to automated welding, and is the process of choice for commercial weld overlay applications. Using the newly developed filler metals, we have prepared clad specimens for testing in a variety of environments both in-house and outside ORNL, including laboratory and commercial organizations. As a means of assessing the field performance of this new type of material, we have modified several non-pressure boundary boiler components, including fuel nozzles and port shrouds, by introducing areas of weld overlay in strategic locations, and have placed these components in service in operating boilers for a side-by-side comparison with conventional corrosion-resistant materials.

  4. Prolonged use of coloured overlays for classroom reading.

    PubMed

    Jeanes, R; Busby, A; Martin, J; Lewis, E; Stevenson, N; Pointon, D; Wilkins, A

    1997-11-01

    Ninety-three children in a primary school and 59 children in two first-year classes of a secondary school were asked individually to observe a paragraph of random letters arranged to resemble text, and to compare the perceptual effects on its clarity of coloured plastic sheets overlaid on the text. A total of 29 colours were compared using 10 coloured plastic sheets and 19 pairwise combinations of sheets, one superimposed on another. The resulting colours sampled CIE 1976 hue angle (huv) and saturation (suv) systematically and efficiently. All the children who reported beneficial perceptual effects (53 per cent) were given their preferred overlay or combination of overlays to use as and when they wished. When the children were examined three months later the children tended to choose a colour similar to one they had chosen previously. Ten months later, 22 per cent of those offered the overlaps were still using them of their own volition. These children, but not those who had ceased to use their overlay(s), read randomly ordered simple words more quickly with their overlay than without. In a second independent group of children referred to the Norfolk Sensory Support Service, who used overlays routinely, the reading speed was similar with a grey or clear overlay; and slower than with the chosen coloured overlay, suggesting that reduction of contrast was not the critical factor. In a third independent group of children in a primary school in Kent, the increase in reading speed with the chosen overlay predicted the children who continued to use their overlay during the ensuing eight weeks. PMID:9415962

  5. Lithography aware overlay metrology target design method

    NASA Astrophysics Data System (ADS)

    Lee, Myungjun; Smith, Mark D.; Lee, Joonseuk; Jung, Mirim; Lee, Honggoo; Kim, Youngsik; Han, Sangjun; Adel, Michael E.; Lee, Kangsan; Lee, Dohwa; Choi, Dongsub; Liu, Zephyr; Itzkovich, Tal; Levinski, Vladimir; Levy, Ady

    2016-03-01

    We present a metrology target design (MTD) framework based on co-optimizing lithography and metrology performance. The overlay metrology performance is strongly related to the target design and optimizing the target under different process variations in a high NA optical lithography tool and measurement conditions in a metrology tool becomes critical for sub-20nm nodes. The lithography performance can be quantified by device matching and printability metrics, while accuracy and precision metrics are used to quantify the metrology performance. Based on using these metrics, we demonstrate how the optimized target can improve target printability while maintaining the good metrology performance for rotated dipole illumination used for printing a sub-100nm diagonal feature in a memory active layer. The remaining challenges and the existing tradeoff between metrology and lithography performance are explored with the metrology target designer's perspective. The proposed target design framework is completely general and can be used to optimize targets for different lithography conditions. The results from our analysis are both physically sensible and in good agreement with experimental results.

  6. The Interplanetary Overlay Networking Protocol Accelerator

    NASA Technical Reports Server (NTRS)

    Pang, Jackson; Torgerson, Jordan L.; Clare, Loren P.

    2008-01-01

    A document describes the Interplanetary Overlay Networking Protocol Accelerator (IONAC) an electronic apparatus, now under development, for relaying data at high rates in spacecraft and interplanetary radio-communication systems utilizing a delay-tolerant networking protocol. The protocol includes provisions for transmission and reception of data in bundles (essentially, messages), transfer of custody of a bundle to a recipient relay station at each step of a relay, and return receipts. Because of limitations on energy resources available for such relays, data rates attainable in a conventional software implementation of the protocol are lower than those needed, at any given reasonable energy-consumption rate. Therefore, a main goal in developing the IONAC is to reduce the energy consumption by an order of magnitude and the data-throughput capability by two orders of magnitude. The IONAC prototype is a field-programmable gate array that serves as a reconfigurable hybrid (hardware/ firmware) system for implementation of the protocol. The prototype can decode 108,000 bundles per second and encode 100,000 bundles per second. It includes a bundle-cache static randomaccess memory that enables maintenance of a throughput of 2.7Gb/s, and an Ethernet convergence layer that supports a duplex throughput of 1Gb/s.

  7. Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance

    NASA Astrophysics Data System (ADS)

    Tokaç, M.; Wang, M.; Jaiswal, S.; Rushforth, A. W.; Gallagher, B. L.; Atkinson, D.; Hindmarch, A. T.

    2015-12-01

    We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication that in-plane AMR is a consequence of anisotropic scattering with both volume and interfacial contributions. The interface scattering anisotropy opposes the volume scattering contribution, causing the AMR ratio to diminish as the cobalt film thickness is reduced. An intrinsic interface effect explains the significantly reduced AMR ratio in ultra-thin films.

  8. Impermeable thin AI2O3 overlay for TBC protection from sulfate and vanadate attack in gas turbines

    SciTech Connect

    Scott X. Mao

    2005-10-30

    In order to improve the hot corrosion resistance of conventional YSZ TBC system, a dense and continues overlay of Al{sub 2}O{sub 3} coating of about 0.1-25 {micro}m thick was deposited on the surface of TBC by EB-PVD, high velocity oxy-fuel (HVOF) spray and composite-sol-gel (CSG) techniques. Hot corrosion tests were carried out on the TBC with and without Al{sub 2}O{sub 3} coating in molten salts mixtures (Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5}) at 950 C for 10h. The microstructures of TBC and overlay before and after exposure were examined by means of scanning electron microscopy (SEM), energy-dispersive X-ray spectrometer (EDX), X-ray diffraction (XRD) and secondary ion mass spectrometry (SIMS). In order to investigate the effect of Al{sub 2}O{sub 3} overlay on degradation and spalling of the TBC, indentation test has been employed to study spallation behaviors of YSZ coating with and without Al{sub 2}O{sub 3} overlay. It has been found that TBC will react with V{sub 2}O5 to form YVO{sub 4} in hot corrosion tests. A substantial amount of M-phase of ZrO{sub 2} was formed due to the leaching of Y{sub 2}O{sub 3} from YSZ. During hot corrosion test, there were no significant interactions between overlay Al{sub 2}O{sub 3} coating and molten salts. After exposure, the alumina coating, especially produced by HVOF, was still very dense and cover the surface of YSZ, although they had been translated to {alpha} - Al{sub 2}O{sub 3} from original {gamma} - Al{sub 2}O{sub 3}. As a result, Al{sub 2}O{sub 3} overlay coating decreased the penetration of salts into the YSZ and prevented the YSZ from the attack by molten salts containing vanadium. Accordingly, only a few M-phase was formed in YSZ TBC, compared with TBC without overlay coating. The penetration of salts into alumina coating was thought to be through microcracks formed in overlay Al{sub 2}O{sub 3} coating and at the interface between alumina and zirconia due to the presence of tensile stress in the alumina coating

  9. IMPERMEABLE THIN AL2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2002-08-31

    In order to improve the hot corrosion resistance of conventional YSZ TBC system, the overlay of Al{sub 2}O{sub 3} coating was deposited on the TBC by EB-PVD techniques. Hot corrosion tests were carried out on the TBC with and without Al{sub 2}O{sub 3} coating in molten salts mixtures (Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5}) at 950 C for different time up to 100h. The microstructures of TBC and overlay before and after exposure were examined by means of scanning electron microscopy (SEM), energy-dispersive X-ray spectrometer (EDX) and X-ray diffraction (XRD). It has been found that TBC will react with V{sub 2}O{sub 5} to form YVO{sub 4}. The amount of M-phase, which was formed due to the leaching of Y{sub 2}O{sub 3} from YSZ, was increased with corrosion time. Al{sub 2}O{sub 3} overlay coating deposited by EB-PVD was dense, continues and adherent to the TBC. As a result, overlay Al{sub 2}O{sub 3} coating can prevent the YSZ from the attack by molten salts containing vanadium and decrease the penetration of salts into the YSZ along porous and cracks in the YSZ TBC. The amount of M-phase formed in YSZ covered with an overlay Al{sub 2}O{sub 3} is substantially lower than that formed in conventional YSZ TBC, even after 100h exposure to the molten salts. In the next reporting period, the hot corrosion test of TBC with EB-PVD deposited Al{sub 2}O{sub 3} coating will be again performed. However before hot corrosion tests, the post-annealing will be carried out in vacuum (residual pressure 10 -3 Pa) at 1273K for 1h in order to transform the as-sputtered Al{sub 2}O{sub 3} overlay to crystalline {alpha}-Al{sub 2}O{sub 3} overlay. In addition, the effect of the thickness of overlay Al{sub 2}O{sub 3} on corrosion resistance will also be investigated.

  10. Augmenting reality in Direct View Optical (DVO) overlay applications

    NASA Astrophysics Data System (ADS)

    Hogan, Tim; Edwards, Tim

    2014-06-01

    The integration of overlay displays into rifle scopes can transform precision Direct View Optical (DVO) sights into intelligent interactive fire-control systems. Overlay displays can provide ballistic solutions within the sight for dramatically improved targeting, can fuse sensor video to extend targeting into nighttime or dirty battlefield conditions, and can overlay complex situational awareness information over the real-world scene. High brightness overlay solutions for dismounted soldier applications have previously been hindered by excessive power consumption, weight and bulk making them unsuitable for man-portable, battery powered applications. This paper describes the advancements and capabilities of a high brightness, ultra-low power text and graphics overlay display module developed specifically for integration into DVO weapon sight applications. Central to the overlay display module was the development of a new general purpose low power graphics controller and dual-path display driver electronics. The graphics controller interface is a simple 2-wire RS-232 serial interface compatible with existing weapon systems such as the IBEAM ballistic computer and the RULR and STORM laser rangefinders (LRF). The module features include multiple graphics layers, user configurable fonts and icons, and parameterized vector rendering, making it suitable for general purpose DVO overlay applications. The module is configured for graphics-only operation for daytime use and overlays graphics with video for nighttime applications. The miniature footprint and ultra-low power consumption of the module enables a new generation of intelligent DVO systems and has been implemented for resolutions from VGA to SXGA, in monochrome and color, and in graphics applications with and without sensor video.

  11. Coloured overlays and their effects on reading speed: a review.

    PubMed

    Wilkins, Arnold

    2002-09-01

    Coloured overlays can reduce symptoms of visual stress and improve reading speed. These benefits are reliable and are not attributable simply to placebo effects. Five percent of children in mainstream education read at least 25% more quickly with an overlay, provided they have chosen the colour. The suboptimal design of children's text and the high level of classroom lighting may be partly responsible. PMID:12358317

  12. Highly Efficient Copper-Indium-Selenide Quantum Dot Solar Cells: Suppression of Carrier Recombination by Controlled ZnS Overlayers.

    PubMed

    Kim, Jae-Yup; Yang, Jiwoong; Yu, Jung Ho; Baek, Woonhyuk; Lee, Chul-Ho; Son, Hae Jung; Hyeon, Taeghwan; Ko, Min Jae

    2015-11-24

    Copper-indium-selenide (CISe) quantum dots (QDs) are a promising alternative to the toxic cadmium- and lead-chalcogenide QDs generally used in photovoltaics due to their low toxicity, narrow band gap, and high absorption coefficient. Here, we demonstrate that the photovoltaic performance of CISe QD-sensitized solar cells (QDSCs) can be greatly enhanced simply by optimizing the thickness of ZnS overlayers on the QD-sensitized TiO2 electrodes. By roughly doubling the thickness of the overlayers compared to the conventional one, conversion efficiency is enhanced by about 40%. Impedance studies reveal that the thick ZnS overlayers do not affect the energetic characteristics of the photoanode, yet enhance the kinetic characteristics, leading to more efficient photovoltaic performance. In particular, both interfacial electron recombination with the electrolyte and nonradiative recombination associated with QDs are significantly reduced. As a result, our best cell yields a conversion efficiency of 8.10% under standard solar illumination, a record high for heavy metal-free QD solar cells to date. PMID:26431392

  13. Overlay improvements using a real time machine learning algorithm

    NASA Astrophysics Data System (ADS)

    Schmitt-Weaver, Emil; Kubis, Michael; Henke, Wolfgang; Slotboom, Daan; Hoogenboom, Tom; Mulkens, Jan; Coogans, Martyn; ten Berge, Peter; Verkleij, Dick; van de Mast, Frank

    2014-04-01

    While semiconductor manufacturing is moving towards the 14nm node using immersion lithography, the overlay requirements are tightened to below 5nm. Next to improvements in the immersion scanner platform, enhancements in the overlay optimization and process control are needed to enable these low overlay numbers. Whereas conventional overlay control methods address wafer and lot variation autonomously with wafer pre exposure alignment metrology and post exposure overlay metrology, we see a need to reduce these variations by correlating more of the TWINSCAN system's sensor data directly to the post exposure YieldStar metrology in time. In this paper we will present the results of a study on applying a real time control algorithm based on machine learning technology. Machine learning methods use context and TWINSCAN system sensor data paired with post exposure YieldStar metrology to recognize generic behavior and train the control system to anticipate on this generic behavior. Specific for this study, the data concerns immersion scanner context, sensor data and on-wafer measured overlay data. By making the link between the scanner data and the wafer data we are able to establish a real time relationship. The result is an inline controller that accounts for small changes in scanner hardware performance in time while picking up subtle lot to lot and wafer to wafer deviations introduced by wafer processing.

  14. Residual stresses in weld overlay tubes: A finite element study

    SciTech Connect

    Taljat, B.; Zacharia, T.; Wang, X.L.; Keiser, J.R.; Feng, Z.; Jirinec, M.J.

    1997-01-03

    Residual stresses and strains in a tube with circumferential weld overlay were analyzed by the finite element (FE) method. The objective of this work was to develop and verify a FE model, to determine the magnitude and distribution of residual stresses in the weld overlay tube, and to evaluate the significance of two contributing factors to residual stress: (1) difference in material properties between tube and weld material, and (2) thermal gradients in the weld. An axisymmetric FE model was developed to simulate the circumferential two-layer welding process of alloy 625 overlay on SA210 tube. The first layer was modeled as a gas metal arc welding process with filler metal, whereas the autogenous gas tungsten arc welding process was modeled for the second layer. Neutron diffraction technique was used to experimentally determine residual elastic strains in the weld overlay tube. Comparison with the FE results shows overall good agreement. Both the experimental and FE results show high compressive stresses at the inside tube surface and high tensile stresses in the weld overlay. This suggests that weld overlay may be used to relieve tensile or produce compressive stresses at the inside tube surface, which is significant for applications where crack initiation is found at the root pass of the joining weld.

  15. ``Electric growth`` of metal overlayers on semiconductor substrates

    SciTech Connect

    Zhang, Z.; Cho, J.H. |; Niu, Q.; Shih, C.K.; Suo, Z.

    1998-02-01

    In this article, the authors present the main results from their recent studies of metal overlayer growth on semiconductor substrates. They show that a variety of novel phenomena can exist in such systems, resulting from several competing interactions. The confined motion of the conduction electrons within the metal overlayer can mediate a surprisingly long-range repulsive force between the metal-semiconductor interface and the growth front, acting to stabilize the overlayer. Electron transfer from the overlayer to the substrate leads to an attractive force between the two interfaces, acting to destabilize the overlayer. Interface-induced Friedel oscillations in electron density can further impose an oscillatory modulation onto the two previous interactions. These three competing factors, of all electronic nature, can make a flat metal overlayer critically, marginally, or magically stable, or totally unstable against roughening. The authors further show that, for many systems, these electronic effects can easily win over the effect of stress. First-principles studies of a few representative systems support the main features of the present electronic growth concept.

  16. Interplanetary Overlay Network Bundle Protocol Implementation

    NASA Technical Reports Server (NTRS)

    Burleigh, Scott C.

    2011-01-01

    The Interplanetary Overlay Network (ION) system's BP package, an implementation of the Delay-Tolerant Networking (DTN) Bundle Protocol (BP) and supporting services, has been specifically designed to be suitable for use on deep-space robotic vehicles. Although the ION BP implementation is unique in its use of zero-copy objects for high performance, and in its use of resource-sensitive rate control, it is fully interoperable with other implementations of the BP specification (Internet RFC 5050). The ION BP implementation is built using the same software infrastructure that underlies the implementation of the CCSDS (Consultative Committee for Space Data Systems) File Delivery Protocol (CFDP) built into the flight software of Deep Impact. It is designed to minimize resource consumption, while maximizing operational robustness. For example, no dynamic allocation of system memory is required. Like all the other ION packages, ION's BP implementation is designed to port readily between Linux and Solaris (for easy development and for ground system operations) and VxWorks (for flight systems operations). The exact same source code is exercised in both environments. Initially included in the ION BP implementations are the following: libraries of functions used in constructing bundle forwarders and convergence-layer (CL) input and output adapters; a simple prototype bundle forwarder and associated CL adapters designed to run over an IPbased local area network; administrative tools for managing a simple DTN infrastructure built from these components; a background daemon process that silently destroys bundles whose time-to-live intervals have expired; a library of functions exposed to applications, enabling them to issue and receive data encapsulated in DTN bundles; and some simple applications that can be used for system checkout and benchmarking.

  17. Refractive index sensitivity of optical fiber lossy-mode resonance sensors based on atomic layer deposited TiOx thin overlay

    NASA Astrophysics Data System (ADS)

    Burnat, Dariusz; Koba, Marcin; Wachnicki, Łukasz; Gierałtowska, Sylwia; Godlewski, Marek; Śmietana, Mateusz

    2016-05-01

    This work presents an optical fiber refractive index sensors based on lossy-mode resonance (LMR) effect supported by titanium oxide (TiOx) thin overlay. The TiOx overlays of different thickness were deposited on core of polymer-clad silica (PCS) fibers using atomic layer deposition (ALD) method. Based on numerical simulations, a number of structures differing in the location of exposed core area and the thickness of TiOx coatings were designed. For fabricated structures the spectral response to external refractive index (next) was measured. The maximum sensitivity reaches 634.2 nm/RIU (next range: 1.357 - 1.402 RIU; TiOx coating thickness: 260.9 nm; investigated spectral range: 500-800 nm) and it highly depends on the thin-film thickness.

  18. Overlay progress in EUV lithography towards adoption for manufacturing

    NASA Astrophysics Data System (ADS)

    Hermans, Jan V.; Laidler, David; Pigneret, Charles; van Dijk, Andre; Voznyi, Oleg; Dusa, Mircea; Hendrickx, Eric

    2011-04-01

    Extreme Ultra-Violet (EUV) lithography is a candidate for semiconductor manufacturing for the 16nm technology node and beyond. Due to the very short wavelength of 13.5nm, EUV lithography provides the capability to continue single exposure scaling with improved resolution and higher pattern fidelity compared to 193nm immersion lithography. However, reducing the wavelength brings new equipment and process challenges. To enable EUV photon transmission through the optical system, the entire optical path of an EUV exposure tool operates under vacuum, and in addition reticle and optics are reflective. To obtain the required CD and overlay performance, both wafer and reticle front surfaces need to have near-perfect flatness, as non-flatness directly contributes to focus and image placement errors, in the case of the reticle due to non-telecentricity. Traditional vacuum chucks, both for reticle and wafer, cannot be used and are replaced by electrostatic chucks. Any contribution of this new clamping method on CD and overlay control therefore needs to be investigated, including avoidance of particle contamination over time. This work was performed on ASML's EUV Alpha Demo Tool (ADT). We investigated the different, non-conventional contributions to overlay control on the ADT, with particular attention to the wafer clamping performance of the exposure chuck. We demonstrate that we were able to improve the overlay performance by compensating for the wafer clamping error during the wafer alignment sequence. The impact of different wafer types on overlay was also evaluated. In addition to clamping effects, thermal effects have also been shown to impact overlay and were evaluated by monitoring the thermal behavior of a wafer during exposure on the ADT and correlating to the resulting overlay.

  19. Large dynamic range Atomic Force Microscope for overlay improvements

    NASA Astrophysics Data System (ADS)

    Kuiper, Stefan; Fritz, Erik; Crowcombe, Will; Liebig, Thomas; Kramer, Geerten; Witvoet, Gert; Duivenvoorde, Tom; Overtoom, Ton; Rijnbeek, Ramon; van Zwet, Erwin; van Dijsseldonk, Anton; den Boef, Arie; Beems, Marcel; Levasier, Leon

    2016-03-01

    Nowadays most overlay metrology tools assess the overlay performance based on marker features which are deposited next to the functional device features within each layer of the semiconductor device. However, correct overlay of the relatively coarse marker features does not directly guarantee correct overlay of the much smaller device features. This paper presents the development of a tool that allows to measure the relative distance between the marker and device features within each layer of the semiconductor device, which can be used to improve the overlay at device feature level. In order to be effective, the marker to device feature distance should be measured with sub-nanometer measurement uncertainty over several millimeters range. Furthermore, the tool should be capable of profiling the marker features to allows prediction of the location interpretation of the optical diffraction based alignment sensors, which are sensitive for potential asymmetry of the marker features. To enable this, a highly stable Atomic Force Microscope system is being developed. The probe is positioned relative to the wafer with a 6DOF controlled hexapod stage, which has a relatively large positioning range of 8x8mm. The position and orientation of this stage is measured relative to the wafer using 6 interferometers via a highly stable metrology frame. A tilted probe concept is utilized to allow profiling of the high aspect ratio marker and device features. Current activities are aimed at demonstrating the measurement capabilities of the developed AFM system.

  20. Overlay metrology solutions in a triple patterning scheme

    NASA Astrophysics Data System (ADS)

    Leray, Philippe; Mao, Ming; Baudemprez, Bart; Amir, Nuriel

    2015-03-01

    Overlay metrology tool suppliers are offering today several options to their customers: Different hardware (Image Based Overlay or Diffraction Based Overlay), different target designs (with or without segmentation) or different target sizes (from 5 um to 30 um). All these variations are proposed to resolve issues like robustness of the target towards process variations, be more representative of the design or increase the density of measurements. In the frame of the development of a triple patterning BEOL scheme of 10 nm node layer, we compare IBO targets (standard AIM, AIMid and multilayer AIMid). The metrology tools used for the study are KLA-Tencor's nextgeneration Archer 500 system (scatterometry- and imaging-based measurement technologies on the same tool). The overlay response and fingerprint of these targets will be compared using a very dense sampling (up to 51 pts per field). The benefit of indie measurements compared to the traditional scribes is discussed. The contribution of process effects to overlay values are compared to the contribution of the performance of the target. Different targets are combined in one measurement set to benefit from their different strengths (performance vs size). The results are summarized and possible strategies for a triple patterning schemes are proposed.

  1. Instructional geographic information science Map overlay and spatial abilities

    NASA Astrophysics Data System (ADS)

    Tricot, Thomas Alexander, II

    The fundamental goal of this study is to determine if the complex spatial concept of map overlay can be effectively learned by young adolescents through the utilization of an instructional technique based within the foundations of Instructional Geographic Information Science (InGIScience). Percent correct and reaction times were the measures used to analyze the ability of young adolescents to learn the intersect, erase, and union functions of map overlay. The ability to solve for missing inputs, output, or function was also analyzed. Young adolescents of the test group scored higher percent correct and recorded faster reaction times than those of the control group or adults of the expert group by the end of the experiment. The intersect function of map overlay was more difficult in terms of percent correct and reaction time than the erase or union functions. Solving for the first or second input consistently resulted in lower percent correct and higher reaction times throughout the experiment. No overall performance differences were shown to exist between males and females. Results of a subjective "real-world" test also indicated learning by young adolescents. This study has shown that the practice of repetitive instruction and testing has proven effective for enhancing spatial abilities with regard to the map overlay concept. This study found that with practice, young adolescents can learn the map overlay concept and perform at levels equal to or greater than adults. This study has helped to answer the question of whether this development of spatial abilities is possible.

  2. IMPERMEABLE THIN Al2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2002-06-30

    In order to improve the hot corrosion resistance of conventional YSZ TBC system (YSZ/CoNiCrAlY/Inconel 601), an overlay Al{sub 2}O{sub 3} was sprayed on the surface of TBC samples by high velocity oxy-fuel (HVOF) spray techniques. The TBC preparation in Japan was based on our technical requirement by plasma spray. Bond coat CoNiCrAlY and the YSZ was produced by low-pressure plasma spray and air plasma spray respectively. Hot corrosion tests were carried out on the TBC with and without Al{sub 2}O{sub 3} coating in molten salts mixtures (Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5}) at 950 C for 10h. The microstructures of TBC and overlay before and after exposure were examined by means of scanning electron microscopy (SEM), energy-dispersive X-ray spectrometer (EDX) and X-ray diffraction (XRD). It has been found that TBC reacted with V{sub 2}O{sub 5} to form YVO{sub 4}. A substantial amount of M-phase was formed due to the leaching of Y{sub 2}O{sub 3} from YSZ. Al{sub 2}O{sub 3} overlay coating sprayed by HVOF was dense, continues and adherent to the TBC even after exposure to the molten salts. As a result, overlay Al{sub 2}O{sub 3} coating can prevent the YSZ from the attack by molten salts containing vanadium and arrest the penetration of salts into the YSZ along porous and cracks in the YSZ TBC. Accordingly, the amount of M-phase formed in TBC with Al{sub 2}O{sub 3} overlay was significantly lower than that in conventional YSZ TBC system. In the next period, the hot corrosion tests of TBC with EB-PVD Al{sub 2}O{sub 3} coating under Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5} will be again performed at 950 C. However before hot corrosion tests, the post-annealing will be carried at 1273K for 1h in order to transform the as-sputtered {gamma}-Al{sub 2}O{sub 3} overlay to crystalline {alpha}-Al{sub 2}O{sub 3} overlay. In addition, the effect of coating thickness on corrosion resistance and the mechanisms of cracking of EB-PVD alumina layer during hot corrosion will be also

  3. Impermeable thin AI2O3 overlay for TBC protection from sulfate and vanadate attack in gas turbines

    SciTech Connect

    Scott X. Mao

    2005-04-30

    {alpha} - Al{sub 2}O{sub 3} overlay has been deposited on the YSZ surface by the composite-sol-gel route (CSG). Hot corrosion tests were carried out on the TBCs with and without Al{sub 2}O{sub 3} coating in molten salt mixtures (Na{sub 2}SO{sub 4} + 5%V{sub 2}O{sub 5}). The results showed that besides a thin and dense alumina overlay with the thickness of about 100-500 nm formed on the YSZ surface, the microcracks and porous near the surface in YSZ was also occupied by alumina because of penetration of the low viscosity precursor.

  4. Tensile Bond Strength of Latex-Modified Bonded Concrete Overlays

    NASA Astrophysics Data System (ADS)

    Dubois, Cameron; Ramseyer, Chris

    2010-10-01

    The tensile bond strength of bonded concrete overlays was tested using the in-situ pull-off method described in ASTM C 1583 with the goal of determining whether adding latex to the mix design increases bond strength. One slab of ductile concrete (f'c > 12,000 psi) was cast with one half tined, i.e. roughened, and one half steel-troweled, i.e. smooth. The slab surface was sectioned off and overlay mixtures containing different latex contents cast in each section. Partial cores were drilled perpendicular to the surface through the overlay into the substrate. A tensile loading device applied a direct tensile load to each specimen and the load was increased until failure occurred. The tensile bond strength was then calculated for comparison between the specimens.

  5. Cooperative Resource Pricing in Service Overlay Networks for Mobile Agents

    NASA Astrophysics Data System (ADS)

    Nakano, Tadashi; Okaie, Yutaka

    The success of peer-to-peer overlay networks depends on cooperation among participating peers. In this paper, we investigate the degree of cooperation among individual peers required to induce globally favorable properties in an overlay network. Specifically, we consider a resource pricing problem in a market-oriented overlay network where participating peers sell own resources (e.g., CPU cycles) to earn energy which represents some money or rewards in the network. In the resource pricing model presented in this paper, each peer sets the price for own resource based on the degree of cooperation; non-cooperative peers attempt to maximize their own energy gains, while cooperative peers maximize the sum of own and neighbors' energy gains. Simulation results are presented to demonstrate that the network topology is an important factor influencing the minimum degree of cooperation required to increase the network-wide global energy gain.

  6. Constructing Overlay Networks with Short Paths and Low Communication Cost

    NASA Astrophysics Data System (ADS)

    Makikawa, Fuminori; Tsuchiya, Tatsuhiro; Kikuno, Tohru

    A Peer-To-Peer (P2P) application uses an overlay network which is a virtual network constructed over the physical network. Traditional overlay construction methods do not take physical location of nodes into consideration, resulting in a large amount of redundant traffic. Some proximity-aware construction methods have been proposed to address this problem. These methods typically connect nearby nodes in the physical network. However, as the number of nodes increases, the path length of a route between two distant nodes rapidly increases. To alleviate this problem, we propose a technique which can be incorporated in existing overlay construction methods. The idea behind this technique is to employ long links to directly connect distant nodes. Through simulation experiments, we show that using our proposed technique, networks can achieve small path length and low communication cost while maintaining high resiliency to failures.

  7. Tuning carrier density at complex oxide interface with metallic overlayer

    NASA Astrophysics Data System (ADS)

    Zhou, Y.; Shi, Y. J.; Jiang, S. W.; Yue, F. J.; Wang, P.; Ding, H. F.; Wu, D.

    2016-06-01

    We have systematically investigated the electronic transport properties of the LaAlO3/SrTiO3 interfaces with several different metal capping layers. The sheet carrier density can be tuned in a wide range by the metallic overlayer without changing the carrier mobility. The sheet carrier density variation is found to be linearly dependent on the size of metal work function. This behavior is explained by the mechanism of the charge transfer between the oxide interface and the metal overlayer across the LaAlO3 layer. Our results confirm the existence of a built-in electric field in LaAlO3 film with an estimated value of 67.7 eV/Å. Since the metallic overlayer is essential for devices, the present phenomena must be considered for future applications.

  8. Using Mobile Agents and Overlay Networks to Secure Electrical Netoworks

    SciTech Connect

    Dawes, Neal A.; Prosser, Bryan J.; Fulp, Errin W.; McKinnon, Archibald D.

    2013-04-01

    ABSTRACT The use of wandering, mobile agents can provide a robust approach for managing, monitoring, and securing electrical distribution networks. However, the topological structure of electrical networks can affect system performance. For example, if the multi-agent system relies on a regular inspection rate (on average, points of interest are inspected with equal frequency), then locations that are not well connected will on average be inspected less frequently. This paper discusses creation and use of overlay networks that create a virtual grid graph can provide faster coverage and a more uniform average agent sampling rate. Using overlays agents wander a virtual neighborhood consisting of only points of interest that are interconnected in a regular fashion (each point has the same number of neighbors). Experimental results will show that an overlay can often provide better network coverage and a more uniform inspection rate, which can improve cyber security by providing a faster detection of threats

  9. Crystal Zoning and Populations in 'Mt. Shasta' High-magnesian Andesite (HMA): Key in the Reconstruction of a Petrogenetic History Dominated by Magma Mixing and Contamination

    NASA Astrophysics Data System (ADS)

    Streck, M. J.; Leeman, W. L.

    2008-12-01

    HMA lava preserved in the pyroclastic deposits of one scoria cone at the Whaleback shield volcano (N. flank of Mt. Shasta) has been proposed as a primitive mantle-derived magma. However, the majority of phenocryst-sized minerals (mostly clino- and orthopyroxene, lesser olivine, and rare plagioclase) did not simply grow in a cooling HMA magma but instead record interactions between silicic and mafic magmas and between evolved magmas and their country rocks. Critical mineralogical evidence includes the following: 1) abundant reversely step-zoned pyroxenes with low Mg# (63 to ~78) cores overgrown by high Mg# (87- 92) growth bands; 2) occasional normally zoned pyroxenes with high Mg# rim growth bands as in 1); 3) abundant and complex array of spongy-cellular textured orthopyroxene crystals where lower Mg# compositions overprint originally high Mg# (~87) forming patchy zoning; 4) highly fosteritic (Fo89- 94) olivines as overly large, anhedral crystals or as olivine crystal clots; 5) rare plagioclase (~An48-78) as single spongy crystals or plagioclase crystal clots; 6) skeletal quench crystals of ~Fo87 olivine and microphenocyrsts of Mg# ~87 cpx and Mg# 87-93 opx. Within the context of textures, zoning, and major and trace-element compositions, this evidence supports the following petrogenetic history. The earliest discernable event was the formation and crystallization of silicic (dacitic?) magma (as recorded by half of all larger (> 200 μm) crystals and by rare dacitic melt inclusions in the Fe-rich pyroxenes). These magmas resided within a crustal section characterized by country rock composed of abundant orthopyroxene and olivine (i.e. harzburgitic lithology). Some of the dacitic melt infiltrated ultramafic (?) country rock leading to resorption, patchy zoning, and occasionally low Mg# overgrowths on orthopyroxene. Mobilization of selvages of altered and resorbed country rock dispersed abundant xenocrysts (1/3 of all single crystals) and micro-xenoliths. This

  10. Implementing a Trust Overlay Framework for Digital Ecosystems

    NASA Astrophysics Data System (ADS)

    Malone, Paul; McGibney, Jimmy; Botvich, Dmitri; McLaughlin, Mark

    Digital Ecosystems, being decentralised in nature, are inherently untrustworthy environments. This is due to the fact that these environments lack a centralised gatekeeper and identity provider. In order for businesses to operate in these environments there is a need for security measures to support accountability and traceability. This paper describes a trust overlay network developed in the OPAALS project to allow entities participating in digital ecosystems to share experience through the exchange of trust values and to leverage on this network to determine reputation based trustworthiness of unknown and initially untrusted entities. An overlay network is described together with sample algorithms and a discussion on implementation.

  11. High-frequency nonreciprocal reflection from magnetic films with overlayers

    SciTech Connect

    Wang, Ying; Nie, Yan; Camley, R. E.

    2013-11-14

    We perform a theoretical study of the nonreciprocal reflection of high-frequency microwave radiation from ferromagnetic films with thin overlayers. Reflection from metallic ferromagnetic films is always near unity and shows no nonreciprocity. In contrast, reflection from a structure which has a dielectric overlayer on top of a film composed of insulated ferromagnetic nanoparticles or nanostructures can show significant nonreciprocity in the 75–80 GHz frequency range, a very high value. This can be important for devices such as isolators or circulators.

  12. Flexible TWDM PON with WDM overlay for converged services

    NASA Astrophysics Data System (ADS)

    Cheng, Ning

    2015-12-01

    This paper reviews recent developments of flexible TWDM PON (time- and wavelength-division multiplexed passive optical network) with pluggable transceivers for pay-as-you-grow deployment, load balancing, channel protection and power saving. Different architectures for TWDM PON with WDM (wavelength division multiplexed) overlay for converged broadband services are discussed and experimental results are presented for WDM overlay using low-cost self-seeded RSOA (reflective semiconductor optical amplifiers). Challenging issues and possible solutions for future evolution toward software defined flexible PONs (FlexPONs) are also discussed with respect to dynamic lambda flow, elastic bandwidth and flexible reach.

  13. Measured residual stresses in overlay pipe weldments removed from service

    SciTech Connect

    Shack, W.J.

    1985-02-01

    Surface and throughwall residual stresses were measured on an elbow-to-pipe weldment that had been removed from the Hatch-2 reactor about a year after the application of a weld overlay. The results were compared with experimental measurements on three mock-up weldments and with finite-element calculations. The comparison shows that there are significant differences in the form and magnitude of the residual stress distributions. However, even after more than a year of service, the residual stresses over most of the inner surface of the actual plant weldment with an overlay were strongly compressive. 3 refs., 7 figs.

  14. IMPERMEABLE THIN AL2O3 OVERLAY FOR TBC PROTECTION FROM SULFATE AND VANADATE ATTACK IN GAS TURBINES

    SciTech Connect

    Scott X. Mao

    2002-08-31

    In order to improve the hot corrosion resistance of conventional YSZ TBC system, a dense and continues overlay of Al{sub 2}O{sub 3} coating of about 25 {micro}m thick was deposited on the surface of TBC by EB-PVD and high velocity oxy-fuel (HVOF) spray techniques. Hot corrosion tests were carried out on the TBC with and without Al{sub 2}O{sub 3} coating in molten salts mixtures (Na{sub 2}SO{sub 4} + 5% V{sub 2}O5) at 950 C for 10h. The microstructures of TBC and overlay before and after exposure were examined by means of scanning electron microscopy (SEM), energy-dispersive X-ray spectrometer (EDX), X-ray diffraction (XRD) and secondary ion mass spectrometry (SIMS). It has been found that TBC will react with V{sub 2}O{sub 5} to form YVO{sub 4}. A substantial amount of M-phase of ZrO{sub 2} was formed due to the leaching of Y{sub 2}O{sub 3} from YSZ. During hot corrosion test, there were no significant interactions between overlay Al{sub 2}O{sub 3} coating and molten salts. After exposure, the alumina coating, especially produced by HVOF, was still very dense and cover the surface of YSZ, although they had been translated to {alpha}-Al{sub 2}O{sub 3} from original {gamma}-Al{sub 2}O{sub 3}. As a result, Al{sub 2}O{sub 3} overlay coating decreased the penetration of salts into the YSZ and prevented the YSZ from the attack by molten salts containing vanadium. Accordingly, only a few M-phase was formed in YSZ TBC, compared with TBC without overlay coating. The penetration of salts into alumina coating was thought to be through microcracks formed in overlay Al{sub 2}O{sub 3} coating and at the interface between alumina and zirconia due to the presence of tensile stress in the alumina coating. In the next year, we will study the mechanisms of cracking of the overlay Al{sub 2}O{sub 3} layer. The hot corrosion test of TBC with EB-PVD deposited Al{sub 2}O{sub 3} coating will be again performed. However before hot corrosion tests, the post-annealing will be carried out in

  15. Platinum and Palladium Overlayers Dramatically Enhance the Activity of Ruthenium Nanotubes for Alkaline Hydrogen Oxidation

    SciTech Connect

    St. John, Samuel; Atkinson, Robert W.; Unocic, Kinga A.; Unocic, Raymond R.; Zawodzinski, Thomas A.; Papandrew, Alexander B.

    2015-10-18

    Templated vapor synthesis and thermal annealing were used to synthesize unsupported metallic Ru nanotubes with Pt or Pd overlayers. By controlling the elemental composition and thickness of these overlayers, we obtain nanostructures with very high alkaline hydrogen oxidation activity. For nanotubes with a nominal atomic composition of Ru0.90Pt0.10 display a surface-specific activity (2.4 mA/cm2) that is 35 times greater than that of pure Ru nanotubes at a 50 mV overpotential and 2.5 times greater than that of pure Pt nanotubes (0.98 mA/cm2). The surface-segregated structure also confers dramatically increased Pt utilization efficiency. We find a platinum-mass-specific activity of 1240 A/gPt for the optimized nanotube versus 280 A/gPt for carbon-supported Pt nanoparticles and 109 A/gPt for monometallic Pt nanotubes. Here, we attribute the enhancement of both area- and platinum-mass-specific activity to the atomic-scale homeomorphism of the nanotube form factor with adlayer-modified polycrystals. Subsurface ligand and bifunctional effects previously observed on segregated, adlayer-modified polycrystals are translated to nanoscale catalysts.

  16. Platinum and Palladium Overlayers Dramatically Enhance the Activity of Ruthenium Nanotubes for Alkaline Hydrogen Oxidation

    DOE PAGESBeta

    St. John, Samuel; Atkinson, Robert W.; Unocic, Kinga A.; Unocic, Raymond R.; Zawodzinski, Thomas A.; Papandrew, Alexander B.

    2015-10-18

    Templated vapor synthesis and thermal annealing were used to synthesize unsupported metallic Ru nanotubes with Pt or Pd overlayers. By controlling the elemental composition and thickness of these overlayers, we obtain nanostructures with very high alkaline hydrogen oxidation activity. For nanotubes with a nominal atomic composition of Ru0.90Pt0.10 display a surface-specific activity (2.4 mA/cm2) that is 35 times greater than that of pure Ru nanotubes at a 50 mV overpotential and 2.5 times greater than that of pure Pt nanotubes (0.98 mA/cm2). The surface-segregated structure also confers dramatically increased Pt utilization efficiency. We find a platinum-mass-specific activity of 1240 A/gPtmore » for the optimized nanotube versus 280 A/gPt for carbon-supported Pt nanoparticles and 109 A/gPt for monometallic Pt nanotubes. Here, we attribute the enhancement of both area- and platinum-mass-specific activity to the atomic-scale homeomorphism of the nanotube form factor with adlayer-modified polycrystals. Subsurface ligand and bifunctional effects previously observed on segregated, adlayer-modified polycrystals are translated to nanoscale catalysts.« less

  17. Recovery of Sublethally Injured Bacteria Using Selective Agar Overlays.

    ERIC Educational Resources Information Center

    McKillip, John L.

    2001-01-01

    This experiment subjects bacteria in a food sample and an environmental sample to conditions of sublethal stress in order to assess the effectiveness of the agar overlay method to recover sublethally injured cells compared to direct plating onto the appropriate selective medium. (SAH)

  18. Semantic overlay network for large-scale spatial information indexing

    NASA Astrophysics Data System (ADS)

    Zou, Zhiqiang; Wang, Yue; Cao, Kai; Qu, Tianshan; Wang, Zhongmin

    2013-08-01

    The increased demand for online services of spatial information poses new challenges to the combined filed of Computer Science and Geographic Information Science. Amongst others, these include fast indexing of spatial data in distributed networks. In this paper we propose a novel semantic overlay network for large-scale multi-dimensional spatial information indexing, called SON_LSII, which has a hybrid structure integrating a semantic quad-tree and Chord ring. The SON_LSII is a small world overlay network that achieves a very competitive trade-off between indexing efficiency and maintenance overhead. To create SON_LSII, we use an effective semantic clustering strategy that considers two aspects, i.e., the semantic of spatial information that peer holds in overlay network and physical network performances. Based on SON_LSII, a mapping method is used to reduce the multi-dimensional features into a single dimension and an efficient indexing algorithm is presented to support complex range queries of the spatial information with a massive number of concurrent users. The results from extensive experiments demonstrate that SON_LSII is superior to existing overlay networks in various respects, including scalability, maintenance, rate of indexing hits, indexing logical hops, and adaptability. Thus, the proposed SON_LSII can be used for large-scale spatial information indexing.

  19. Factors affecting the erosion resistance of weld overlays

    SciTech Connect

    Levin, B.F.; Dupont, J.N.; Marder, A.R.

    1996-12-31

    Research was conducted to study factors affecting the solid particle erosion resistance of weld overlay coatings. Eleven weld overlay alloys were deposited on 1018 steel substrates using the plasma arc welding process and erosion tested at 400 C. Erosion resistance was evaluated by determining the steady state erosion rate. Ultimet, Inconel-625, and 316L SS coatings showed the best erosion resistance at 30 and 90{degree} impact angles. Microhardness tests were performed on the eroded samples below the erosion surface to determine the size of the plastically deformed zone and it was found that one group of coatings deformed plastically as a result of the particle impact while the others did not. No correlations were found between average microhardness at 400 C and volumetric erosion rates for plastically deformed weld overlays. For this group of overlays erosion resistance was correlated to the area under the curve of microhardness versus distance from the eroded surface. The physical significance of this parameter is discussed. For coatings that did not deform plastically, an increase in average microhardness at 400 C led to an increase in their volumetric erosion rates. The possible erosion mechanisms for these coating groups are discussed.

  20. Promoting Learning of Instructional Design via Overlay Design Tools

    ERIC Educational Resources Information Center

    Carle, Andrew Jacob

    2012-01-01

    I begin by introducing Virtual Design Apprenticeship (VDA), a learning model--built on a solid foundation of education principles and theories--that promotes learning of design skills via overlay design tools. In VDA, when an individual needs to learn a new design skill or paradigm she is provided accessible, concrete examples that have been…

  1. Incidental Learning of Geospatial Concepts across Grade Levels: Map Overlay

    ERIC Educational Resources Information Center

    Battersby, Sarah E.; Golledge, Reginald G.; Marsh, Meredith J.

    2006-01-01

    In this paper, the authors evaluate map overlay, a concept central to geospatial thinking, to determine how it is naively and technically understood, as well as to identify when it is leaner innately. The evaluation is supported by results from studies at three grade levels to show the progression of incidentally learned geospatial knowledge as…

  2. 12. DETAIL INDICATING TRANSITION FROM ORIGINAL SURFACE TO GUNITE OVERLAY ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    12. DETAIL INDICATING TRANSITION FROM ORIGINAL SURFACE TO GUNITE OVERLAY ON UPSTREAM EMBANKMENT OF DAM (FROM REPAIRS COMPLETED IN 1977) - Upper Doughty Dam, 200 feet west of Garden State Parkway, 1.7 miles west of Absecon, Egg Harbor City, Atlantic County, NJ

  3. Crosslayer Survivability in Overlay-IP-WDM Networks

    ERIC Educational Resources Information Center

    Pacharintanakul, Peera

    2010-01-01

    As the Internet moves towards a three-layer architecture consisting of overlay networks on top of the IP network layer on top of WDM-based physical networks, incorporating the interaction between and among network layers is crucial for efficient and effective implementation of survivability. This dissertation has four major foci as follows:…

  4. BWR pipe crack and weld clad overlay studies

    SciTech Connect

    Shack, W.J.; Kassner, T.F.; Maiya, P.S.; Park, J.Y.; Ruther, W.E.; Rybicki, E.F.

    1985-10-01

    This paper presents results on (a) the influence of simulated BWR environments and temperature on the intergranular-stress-corrosion cracking (IGSCC) susceptibility of sensitized stainless steels (SS), (b) the stress-corrosion susceptibility of alternative piping materials, (c) analysis of field components to assess the effectiveness of in-service inspection techniques and the in-reactor performance of weld overlay repairs, and (d) finite-element analyses and experimental measurement of residual stresses in weldments with weld overlays. Fracture-mechanics crack-growth data are presented to confirm correlations between the critical corrosion potentials required to inhibit IGSCC and the level of impurities in the environment. Slow-strain-rate tests show that very low levels of impurities (25 ppb of sulfate) can produce suseptibility to transgranular-stress-corrosion cracking (TGSCC) in Type 316NG SS and that nitrogen levels is SS above 0.1 wt. % appear to increase susceptibility to TGSCC. Preliminary results on a German Type 347NG SS suggest that it is at least as resistant to TGSCC in impurity environments as Type 316NG SS. Measurements on overlay weldments removed from the Hatch-2 reactor confirm that compressive residual stresses are produced on the inner surface of the weldments by the overlay.

  5. Study on overlay AEI-ADI shift on contact layer of advanced technology node

    NASA Astrophysics Data System (ADS)

    Deng, Guogui; Hao, Jingan; Xiao, Lihong; Xing, Bin; Jiang, Yuntao; He, Kaiting; Zhang, Qiang; He, Weiming; Liu, Chang; Lin, Yi-Shih; Wu, Qiang; Shi, Xuelong

    2016-03-01

    In this paper, we present a study on the overlay (OVL) shift issue in contact (CT) layer aligned to poly-silicon (short as poly) layer (prior layer) in an advanced technology node [1, 2]. We have showed the wafer level OVL AEI-ADI shift (AEI: After Etch Inspection; ADI: After Developing Inspection; AEI-ADI: AEI minus ADI). Within the shot level map, there exists a center-edge difference. The OVL focus subtraction map can well match the OVL AEI-ADI shift map. Investigation into this interesting correlation finally leads to the conclusion of PR tilt. The film stress of the thick hard mask is responsible for the PR tilt. The method of OVL focus subtraction can therefore be a powerful and convenient tool to represent the OVL mark profile. It is also important to take into account the film deposition when investigating OVL AEI-ADI shift.

  6. Throughput and Packet Delay Analysis of the Intermittent DCF for Overlay Access Networks

    NASA Astrophysics Data System (ADS)

    Adamis, Athanassios V.; Maliatsos, Konstantinos N.; Constantinou, Philip

    Overlay Access Technology can compensate for the spectrum underutilization problem by exploiting Cognitive Radios capabilities. MAC design is an important aspect of Overlay Access research. In this paper we present the overlay access environment and the challenges it poses to MAC design. Then, we propose the use of a modified Distributed Coordination Function as the MAC protocol for distributed Overlay Access networks. The resulted Intermittent DCF performs with robustness in the demanding overlay access environment, which is characterized by frequent spectrum scan procedure interruptions and low achievable transmission rates. The most recent DCF Markov Chain Model is extended in order to include the overlay operation modifications. Our extension concerns the slot duration expectations calculation which, in the overlay environment, have not constant values but depend on overlay operation parameters. Using the analytical model we evaluate the performance of the DCF under the effect of certain overlay access parameters. The new analytical model predictions are validated with simulations, and are found to accurately capture many interesting features of the overlay operation. Our model can be used in feasibility studies of realistic overlay scenarios and in admission control algorithms of QoS enabled distributed overlay access networks that engage the Intermittent DCF.

  7. Thick Toenails

    MedlinePlus

    ... be seen in individuals with nail fungus (onychomycosis), psoriasis, and hypothyroidism. Those who have problems with the thickness of their toenails should consult a foot and ankle surgeon for proper diagnosis and treatment. and or or and or or, browse by ...

  8. Structural analyses of a rigid pavement overlaying a sub-surface void

    NASA Astrophysics Data System (ADS)

    Adam, Fatih Alperen

    Pavement failures are very hazardous for public safety and serviceability. These failures in pavements are mainly caused by subsurface voids, cracks, and undulation at the slab-base interface. On the other hand, current structural analysis procedures for rigid pavement assume that the slab-base interface is perfectly planar and no imperfections exist in the sub-surface soil. This assumption would be violated if severe erosion were to occur due to inadequate drainage, thermal movements, and/or mechanical loading. Until now, the effect of erosion was only considered in the faulting performance model, but not with regards to transverse cracking at the mid-slab edge. In this research, the bottom up fatigue cracking potential, caused by the combined effects of wheel loading and a localized imperfection in the form of a void below the mid-slab edge, is studied. A robust stress and surface deflection analysis was also conducted to evaluate the influence of a sub-surface void on layer moduli back-calculation. Rehabilitative measures were considered, which included a study on overlay and fill remediation. A series regression of equations was proposed that provides a relationship between void size, layer moduli stiffness, and the overlay thickness required to reduce the stress to its original pre-void level. The effect of the void on 3D pavement crack propagation was also studied under a single axle load. The amplifications to the stress intensity was shown to be high but could be mitigated substantially if stiff material is used to fill the void and impede crack growth. The pavement system was modeled using the commercial finite element modeling program Abaqus RTM. More than 10,000 runs were executed to do the following analysis: stress analysis of subsurface voids, E-moduli back-calculation of base layer, pavement damage calculations of Beaumont, TX, overlay thickness estimations, and mode I crack analysis. The results indicate that the stress and stress intensity are, on

  9. Perspective with Landsat Overlay, Mount Kilimanjaro, Tanzania

    NASA Technical Reports Server (NTRS)

    2002-01-01

    Mount Kilimanjaro (Kilima Njaro or 'shining mountain' in Swahili), the highest point in Africa, reaches 5,895 meters (19,340 feet) above sea level, tall enough to maintain a permanent snow cap despite being just 330 kilometers (210 miles) south of the equator. It is the tallest free-standing mountain on the Earth's land surface world, rising about 4,600 meters (15,000 feet) above the surrounding plain. Kilimanjaro is a triple volcano (has three peaks) that last erupted perhaps more than 100,000 years ago but still exudes volcanic gases. It is accompanied by about 20 other nearby volcanoes, some of which are seen to the west (left) in this view, prominently including Mount Meru, which last erupted only about a century ago. The volcanic mountain slopes are commonly fertile and support thick forests, while the much drier grasslands of the plains are home to elephants, lions, and other savanna wildlife.

    This 3-D perspective view was generated using topographic data from the Shuttle Radar Topography Mission (SRTM), a Landsat 7 satellite image, and a false sky. Topographic expression is vertically exaggerated two times.

    Landsat has been providing visible and infrared views of the Earth since 1972. SRTM elevation data matches the 30-meter (98-foot) resolution of most Landsat images and will substantially help in analyzing the large and growing Landsat image archive, managed by the U.S. Geological Survey (USGS).

    Elevation data used in this image was acquired by the Shuttle Radar Topography Mission (SRTM) aboard the Space Shuttle Endeavour, launched on Feb. 11, 2000. SRTM used the same radar instrument that comprised the Spaceborne Imaging Radar-C/X-Band Synthetic Aperture Radar (SIR-C/X-SAR) that flew twice on the Space Shuttle Endeavour in 1994. SRTM was designed to collect 3-D measurements of the Earth's surface. To collect the 3-D data, engineers added a 60-meter (approximately 200-foot) mast, installed additional C-band and X-band antennas, and improved

  10. Optical resonance analysis of reflected long period fiber gratings with metal film overlay

    NASA Astrophysics Data System (ADS)

    Zhang, Guiju; Cao, Bing; Wang, Chinua; Zhao, Minfu

    2008-11-01

    We present the experimental results of a novel single-ended reflecting surface plasma resonance (SPR) based long period fiber grating (LPFG) sensor. A long period fiber grating sensing device is properly designed and fabricated with a pulsed CO2 laser writing system. Different nm-thick thin metal films are deposited on the fiber cladding and the fiber end facet for the excitation of surface plasma waves (SPWs) and the reflection of the transmission spectrum of the LPFG with doubled interaction between metal-dielectric interfaces of the fiber to enhance the SPW of the all-fiber SPR-LPFG sensing system. Different thin metal films with different thicknesses are investigated. The effect of the excited SPW transmission along the fiber cladding-metal interface with silver and aluminum films is observed. It is found that different thicknesses of the metal overlay show different resonant behaviors in terms of resonance peak situation, bandwidth and energy loss. Within a certain range, thinner metal film shows narrower bandwidth and deeper peak loss.

  11. Flutter Analysis of the Shuttle Tile Overlay Repair Concept

    NASA Technical Reports Server (NTRS)

    Bey, Kim S.; Scott, Robert C.; Bartels, Robert E.; Waters, William A.; Chen, Roger

    2007-01-01

    The Space Shuttle tile overlay repair concept, developed at the NASA Johnson Space Center, is designed for on-orbit installation over an area of damaged tile to permit safe re-entry. The thin flexible plate is placed over the damaged area and secured to tile at discreet points around its perimeter. A series of flutter analyses were performed to determine if the onset of flutter met the required safety margins. Normal vibration modes of the panel, obtained from a simplified structural analysis of the installed concept, were combined with a series of aerodynamic analyses of increasing levels of fidelity in terms of modeling the flow physics to determine the onset of flutter. Results from these analyses indicate that it is unlikely that the overlay installed at body point 1800 will flutter during re-entry.

  12. Modeling the dynamical interaction between epidemics on overlay networks

    NASA Astrophysics Data System (ADS)

    Marceau, Vincent; Noël, Pierre-André; Hébert-Dufresne, Laurent; Allard, Antoine; Dubé, Louis J.

    2011-08-01

    Epidemics seldom occur as isolated phenomena. Typically, two or more viral agents spread within the same host population and may interact dynamically with each other. We present a general model where two viral agents interact via an immunity mechanism as they propagate simultaneously on two networks connecting the same set of nodes. By exploiting a correspondence between the propagation dynamics and a dynamical process performing progressive network generation, we develop an analytical approach that accurately captures the dynamical interaction between epidemics on overlay networks. The formalism allows for overlay networks with arbitrary joint degree distribution and overlap. To illustrate the versatility of our approach, we consider a hypothetical delayed intervention scenario in which an immunizing agent is disseminated in a host population to hinder the propagation of an undesirable agent (e.g., the spread of preventive information in the context of an emerging infectious disease).

  13. On-demand Overlay Networks for Large Scientific Data Transfers

    SciTech Connect

    Ramakrishnan, Lavanya; Guok, Chin; Jackson, Keith; Kissel, Ezra; Swany, D. Martin; Agarwal, Deborah

    2009-10-12

    Large scale scientific data transfers are central to scientific processes. Data from large experimental facilities have to be moved to local institutions for analysis or often data needs to be moved between local clusters and large supercomputing centers. In this paper, we propose and evaluate a network overlay architecture to enable highthroughput, on-demand, coordinated data transfers over wide-area networks. Our work leverages Phoebus and On-demand Secure Circuits and AdvanceReservation System (OSCARS) to provide high performance wide-area network connections. OSCARS enables dynamic provisioning of network paths with guaranteed bandwidth and Phoebus enables the coordination and effective utilization of the OSCARS network paths. Our evaluation shows that this approach leads to improved end-to-end data transfer throughput with minimal overheads. The achievedthroughput using our overlay was limited only by the ability of the end hosts to sink the data.

  14. Chlorine adsorption on Au(111): chlorine overlayer or surface chloride?

    PubMed

    Gao, Weiwei; Baker, Thomas A; Zhou, Ling; Pinnaduwage, Dilini S; Kaxiras, Efthimios; Friend, Cynthia M

    2008-03-19

    We report the first scanning tunneling microscope (STM) investigation, combined with density functional theory calculations, to resolve controversy regarding the bonding and structure of chlorine adsorbed on Au(111). STM experiments are carried out at 120 K to overcome instability caused by mobile species upon chlorine adsorption at room temperature. Chlorine adsorption initially lifts the herringbone reconstruction. At low coverages (<0.33 ML), chlorine binds to the top of Au(111)-(1 x 1) surface and leads to formation of an overlayer with (square root(3) x square root(3))R30 degree structure at 0.33 ML. At higher coverages, packing chlorine into an overlayer structure is no longer favored. Gold atoms incorporate into a complex superlattice of a Au-Cl surface compound. PMID:18290645

  15. Improved overlay metrology device correlation on 90-nm logic processes

    NASA Astrophysics Data System (ADS)

    Ueno, Atsushi; Tsujita, Kouichirou; Kurita, Hiroyuki; Iwata, Yasuhisa; Ghinovker, Mark; Poplawski, Jorge M.; Kassel, Elyakim; Adel, Mike E.

    2004-05-01

    Isolated and dense patterns were formed at process layers from gate through to back-end on wafers using a 90 nm logic device process utilizing ArF lithography under various lithography conditions. Pattern placement errors (PPE) between AIM grating and BiB marks were characterized for line widths varying from 1000nm to 140nm. As pattern size was reduced, overlay discrepancies became larger, a tendency which was confirmed by optical simulation with simple coma aberration. Furthermore, incorporating such small patterns into conventional marks resulted in significant degradation in metrology performance while performance on small pattern segmented grating marks was excellent. Finally, the data also show good correlation between the grating mark and specialized design rule feature SEM marks, with poorer correlation between conventional mark and SEM mark confirming that new grating mark significantly improves overlay metrology correlation with device patterns.

  16. CLIO — A Cross-Layer Information Service for Overlay Network Optimization

    NASA Astrophysics Data System (ADS)

    Haage, Dirk; Holz, Ralph; Niedermayer, Heiko; Laskov, Pavel

    New overlay-based services aim to provide properties like resilience, availability or QoS. To achieve this, automatic organization and optimization is required, which again demands accurate information on the network. Collecting and exchanging this data has a significant impact on the network, especially if several overlays are used on the same host. In this paper, we provide a survey of the current state of the art and identify challenges which must be addressed in order for new overlay-based services to be successful. We present our own solution CLIO, a cross-layer information service for overlays. CLIO provides information for the automatic creation and optimization of overlays. The service supports multiple overlays on the same node, the provided information is overlay-independent, and collected information is reused.

  17. Prepenetrant Etchant For Incology(R) 903 Weld Overlays

    NASA Technical Reports Server (NTRS)

    O'Tousa, Joseph E.; Thomas, Clark S.; Foster, Robert E.

    1990-01-01

    Etching solution developed for use prior to type-IVc penetrant inspection of Incology(R) 903 weld overlays. Formulated as follows: 80 g ferric chloride hexahydrate, 300 mL reagent-grade hydrochloric acid, 25 mL food- or reagent-grade phosphoric acid, and 100 mL ethylene glycol. Gives more reasonable range of etching time and reduces probability of overetching and resulting damage. Stored indefinitely.

  18. Diffusion Barriers to Increase the Oxidative Life of Overlay Coatings

    NASA Technical Reports Server (NTRS)

    Nesbitt, James A.; Lei, Jih-Fen

    1999-01-01

    Currently, most blades and vanes in the hottest section of aero gas turbine engines require some type of coating for oxidation protection. Newly developed single crystal superalloys have the mechanical potential to operate at increasingly higher component temperatures. However, at these elevated temperatures, coating/substrate interdiffusion can shorten the protective life of the coating. Diffusion barriers between overlay coatings and substrates are being examined to extend the protective life of the coating. A previously- developed finite-difference diffusion model has been modified to predict the oxidative life enhancement due to use of a diffusion barrier. The original diffusion model, designated COSIM, simulates Al diffusion in the coating to the growing oxide scale as well as Al diffusion into the substrate. The COSIM model incorporates an oxide growth and spalling model to provide the rate of Al consumption during cyclic oxidation. Coating failure is predicted when the Al concentration at the coating surface drops to a defined critical level. The modified COSIM model predicts the oxidative life of an overlay coating when a diffusion barrier is present eliminating diffusion of Al from the coating into the substrate. Both the original and the modified diffusion models have been used to predict the effectiveness of a diffusion barrier in extending the protective life of a NiCrAl overlay coating undergoing cyclic oxidation at 1100 C.

  19. An Overlapping Structured P2P for REIK Overlay Network

    NASA Astrophysics Data System (ADS)

    Liu, Wenjun; Song, Jingjing; Yu, Jiguo

    REIK is based on a ring which embedded an inverse Kautz digraph, to enable multi-path P2P routing. It has the constant degree and the logarithmic diameter DHT scheme with constant congestion and Byzantine fault tolerance. However, REIK did not consider the interconnection of many independent smaller networks. In this paper, we propose a new approach to build overlay network, OLS-REIK which is an overlapping structured P2P for REIK overlay network. It is a more flexible interconnecting different REIK network. Peers can belong to several rings, allowing this interconnection. By connecting smaller structured overlay networks in an unstructured way, it provides a cost effective alternative to hierarchical structured P2P systems requiring costly merging. Routing of lookup messages is performed as in REIK within one ring, but a peer belonging to several rings forwards the request to the different rings it belongs to. Furthermore a small number of across point is enough to ensure a high exhaustiveness level.

  20. Overlay mark optimization using the KTD signal simulation system

    NASA Astrophysics Data System (ADS)

    Marchelli, Anat; Gutjahr, Karsten; Kubis, Michael; Sparka, Christian; Ghinovker, Mark; Navarra, Alessandra; Widmann, Amir

    2009-03-01

    As the overlay performance and accuracy requirements become tighter, the impact of process parameters on the target signal becomes more significant. Traditionally, in order to choose the optimum overlay target, several candidates are placed in the kerf area. The candidate targets are tested under different process conditions, before the target to be used in mass production is selected. The varieties of targets are left on the mass production mask and although they will not be used for overlay measurements they still consume kerf real estate. To improve the efficiency of the process we are proposing the KTD (KLA-Tencor Target Designer). It is an easy to use system that enables the user to select the optimum target based on advanced signal simulation. Implementing the KTD in production is expected to save 30% of kerf real estate due to more efficient target design process as well as reduced engineering time. In this work we demonstrate the capability of the KTD to simulate the Archer signal in the context of advanced DRAM processes. For several stacks we are comparing simulated target signals with the Archer100 signals. We demonstrate the robustness feature in the KTD application that enables the user to test the target sensitivity to process changes. The results indicate the benefit of using KTD in the target optimization process.

  1. Multicast Routing in Structured Overlays and Hybrid Networks

    NASA Astrophysics Data System (ADS)

    Wählisch, Matthias; Schmidt, Thomas C.

    Key-based routing has enabled efficient group communication on the application or service middleware layer, stimulated by the need of applications to access multicast. These developments follow a continuous debate about network layer multicast that had lasted for about 30 years history of the Internet. The IP host group model today still faces a strongly divergent state of deployment. In this chapter, we first review the key concepts of multicast and broadcast data distribution on structured overlays. Second, we perform a comprehensive theoretical analysis examining the different distribution trees constructed on top of a key-based routing layer. Characteristic performance measures of the multicast approaches are compared in detail and major structural differences are identified. Overlay multicast overcomes deployment problems on the price of a performance penalty. Hybrid approaches, which dynamically combine multicast in overlay and underlay, adaptively optimize group communication. We discuss current schemes along with its integration in common multicast routing protocols in the third part of this chapter. Finally, we reconsider and enhance approaches to a common API for group communication, which serves the requirements of data distribution and maintenance for multicast and broadcast on a middleware abstraction layer, and in particular facilitates hybrid multicast schemes.

  2. Label-free sensitivity of long-period gratings enhanced by atomic layer deposited TiO(2) nano-overlays.

    PubMed

    Smietana, Mateusz; Koba, Marcin; Brzozowska, Ewa; Krogulski, Krzysztof; Nakonieczny, Jakub; Wachnicki, Lukasz; Mikulic, Predrag; Godlewski, Marek; Bock, Wojtek J

    2015-04-01

    In this paper, we discuss an impact of thin titanium dioxide (TiO(2)) coatings on refractive index (RI) sensitivity and biofunctionalization of long-period gratings (LPGs). The TiO(2) overlays on the LPG surfaces have been obtained using atomic layer deposition (ALD) method. This method allows for a deposition of conformal, thickness-controlled, with well-defined optical properties, and high-RI thin films which are highly desired for optical fiber sensors. It has been found that for LPGs working at a dispersion turning point of higher order cladding modes only tens of nanometers of TiO(2) overlay thickness allow to obtain cladding mode transition effect, and thus significant improvement of RI sensitivity. When the TiO(2) overlay thickness reaches 70 nm, it is possible to obtain RI sensitivity exceeding 6200 nm/RIU in RI range where label-free sensors operate. Moreover, LPGs with TiO(2)-enhanced RI sensitivity have shown improved sensitivity to bacteria endotoxin (E. coli B lipopolysaccharide) detection, when TiO(2) surface is functionalized with endotoxin binding protein (adhesin) of T4 bacteriophage. PMID:25968683

  3. Improved antifouling properties and selective biofunctionalization of stainless steel by employing heterobifunctional silane-polyethylene glycol overlayers and avidin-biotin technology.

    PubMed

    Hynninen, Ville; Vuori, Leena; Hannula, Markku; Tapio, Kosti; Lahtonen, Kimmo; Isoniemi, Tommi; Lehtonen, Elina; Hirsimäki, Mika; Toppari, J Jussi; Valden, Mika; Hytönen, Vesa P

    2016-01-01

    A straightforward solution-based method to modify the biofunctionality of stainless steel (SS) using heterobifunctional silane-polyethylene glycol (silane-PEG) overlayers is reported. Reduced nonspecific biofouling of both proteins and bacteria onto SS and further selective biofunctionalization of the modified surface were achieved. According to photoelectron spectroscopy analyses, the silane-PEGs formed less than 10 Å thick overlayers with close to 90% surface coverage and reproducible chemical compositions. Consequently, the surfaces also became more hydrophilic, and the observed non-specific biofouling of proteins was reduced by approximately 70%. In addition, the attachment of E. coli was reduced by more than 65%. Moreover, the potential of the overlayer to be further modified was demonstrated by successfully coupling biotinylated alkaline phosphatase (bAP) to a silane-PEG-biotin overlayer via avidin-biotin bridges. The activity of the immobilized enzyme was shown to be well preserved without compromising the achieved antifouling properties. Overall, the simple solution-based approach enables the tailoring of SS to enhance its activity for biomedical and biotechnological applications. PMID:27381834

  4. Improved antifouling properties and selective biofunctionalization of stainless steel by employing heterobifunctional silane-polyethylene glycol overlayers and avidin-biotin technology

    NASA Astrophysics Data System (ADS)

    Hynninen, Ville; Vuori, Leena; Hannula, Markku; Tapio, Kosti; Lahtonen, Kimmo; Isoniemi, Tommi; Lehtonen, Elina; Hirsimäki, Mika; Toppari, J. Jussi; Valden, Mika; Hytönen, Vesa P.

    2016-07-01

    A straightforward solution-based method to modify the biofunctionality of stainless steel (SS) using heterobifunctional silane-polyethylene glycol (silane-PEG) overlayers is reported. Reduced nonspecific biofouling of both proteins and bacteria onto SS and further selective biofunctionalization of the modified surface were achieved. According to photoelectron spectroscopy analyses, the silane-PEGs formed less than 10 Å thick overlayers with close to 90% surface coverage and reproducible chemical compositions. Consequently, the surfaces also became more hydrophilic, and the observed non-specific biofouling of proteins was reduced by approximately 70%. In addition, the attachment of E. coli was reduced by more than 65%. Moreover, the potential of the overlayer to be further modified was demonstrated by successfully coupling biotinylated alkaline phosphatase (bAP) to a silane-PEG-biotin overlayer via avidin-biotin bridges. The activity of the immobilized enzyme was shown to be well preserved without compromising the achieved antifouling properties. Overall, the simple solution-based approach enables the tailoring of SS to enhance its activity for biomedical and biotechnological applications.

  5. Improved antifouling properties and selective biofunctionalization of stainless steel by employing heterobifunctional silane-polyethylene glycol overlayers and avidin-biotin technology

    PubMed Central

    Hynninen, Ville; Vuori, Leena; Hannula, Markku; Tapio, Kosti; Lahtonen, Kimmo; Isoniemi, Tommi; Lehtonen, Elina; Hirsimäki, Mika; Toppari, J. Jussi; Valden, Mika; Hytönen, Vesa P.

    2016-01-01

    A straightforward solution-based method to modify the biofunctionality of stainless steel (SS) using heterobifunctional silane-polyethylene glycol (silane-PEG) overlayers is reported. Reduced nonspecific biofouling of both proteins and bacteria onto SS and further selective biofunctionalization of the modified surface were achieved. According to photoelectron spectroscopy analyses, the silane-PEGs formed less than 10 Å thick overlayers with close to 90% surface coverage and reproducible chemical compositions. Consequently, the surfaces also became more hydrophilic, and the observed non-specific biofouling of proteins was reduced by approximately 70%. In addition, the attachment of E. coli was reduced by more than 65%. Moreover, the potential of the overlayer to be further modified was demonstrated by successfully coupling biotinylated alkaline phosphatase (bAP) to a silane-PEG-biotin overlayer via avidin-biotin bridges. The activity of the immobilized enzyme was shown to be well preserved without compromising the achieved antifouling properties. Overall, the simple solution-based approach enables the tailoring of SS to enhance its activity for biomedical and biotechnological applications. PMID:27381834

  6. Study of correlation between overlay and displacement measured by Coherent Gradient Sensing (CGS) interferometry

    NASA Astrophysics Data System (ADS)

    Mileham, Jeffrey; Tanaka, Yasushi; Anberg, Doug; Owen, David M.; Lee, Byoung-Ho; Bouche, Eric

    2016-03-01

    Within the semiconductor lithographic process, alignment control is one of the most critical considerations. In order to realize high device performance, semiconductor technology is approaching the 10 nm design rule, which requires progressively smaller overlay budgets. Simultaneously, structures are expanding in the 3rd dimension, thereby increasing the potential for inter-layer distortion. For these reasons, device patterning is becoming increasingly difficult as the portion of the overlay budget attributed to process-induced variation increases. After lithography, overlay gives valuable feedback to the lithography tool; however overlay measurements typically have limited density, especially at the wafer edge, due to throughput considerations. Moreover, since overlay is measured after lithography, it can only react to, but not predict the process-induced overlay. This study is a joint investigation in a high-volume manufacturing environment of the portion of overlay associated with displacement induced by a single process across many chambers. Displacement measurements are measured by Coherent Gradient Sensing (CGS) interferometry, which generates high-density displacement maps (>3 million points on a 300 mm wafer) such that the stresses induced die-by-die and process-by-process can be tracked in detail. The results indicate the relationship between displacement and overlay shows the ability to forecast overlay values before the lithographic process. Details of the correlation including overlay/displacement range, and lot-to-lot displacement variability are considered.

  7. Efficient spin transport through native oxides of nickel and permalloy with platinum and gold overlayers

    NASA Astrophysics Data System (ADS)

    Zink, B. L.; Manno, M.; O'Brien, L.; Lotze, J.; Weiler, M.; Bassett, D.; Mason, S. J.; Goennenwein, S. T. B.; Johnson, M.; Leighton, C.

    2016-05-01

    We present measurements of spin pumping detected by the inverse spin Hall effect voltage and ferromagnetic resonance spectroscopy in a series of metallic ferromagnet/normal metal thin film stacks. We compare heterostructures grown in situ to those where either a magnetic or nonmagnetic oxide is introduced between the two metals. The heterostructures, either nickel with a platinum overlayer (Ni/Pt) or the nickel-iron alloy permalloy (Py) with a gold overlayer (Py/Au), were also characterized in detail using grazing-incidence x-ray reflectivity, Auger electron spectroscopy, and both SQUID and alternating-gradient magnetometry. We verify the presence of oxide layers, characterize layer thickness, composition, and roughness, and probe saturation magnetization, coercivity, and anisotropy. The results show that while the presence of a nonmagnetic oxide at the interface suppresses spin transport from the ferromagnet to the nonmagnetic metal, a thin magnetic oxide (here the native oxide formed on both Py and Ni) somewhat enhances the product of the spin-mixing conductance and the spin Hall angle. We also observe clear evidence of an out-of-plane component of magnetic anisotropy in Ni/Pt samples that is enhanced in the presence of the native oxide, resulting in perpendicular exchange bias. Finally, the dc inverse spin Hall voltages generated at ferromagnetic resonance in our Py/Au samples are large, and suggest values for the spin Hall angle in gold of 0.04 <αSH<0.22 , in line with the highest values reported for Au. This is interpreted as resulting from Fe impurities. We present indirect evidence that the Au films described here indeed have significant impurity levels.

  8. Combined overlay, focus and CD metrology for leading edge lithography

    NASA Astrophysics Data System (ADS)

    Ebert, Martin; Cramer, Hugo; Tel, Wim; Kubis, Michael; Megens, Henry

    2011-04-01

    As leading edge lithography moves to 22-nm design rules, low k1 technologies like double patterning are the new resolution enablers, and system control and setup are the new drivers to meet remarkably tight process requirements. The way of thinking and executing setup and control of lithography scanners is changing in four ways. First, unusually tight process tolerances call for very dense sampling [1], which in effect means measurements at high throughput combined with high order modeling and corrections to compensate for wafer spatial fingerprint. Second, complex interactions between scanner and process no longer allow separation of error sources through traditional metrology approaches, which are based on using one set of metrology tools and methods for setup and another for scanner performance control. Moreover, setup and control of overlay is done independently from CD uniformity, which in effect leads to independent and conflicting adjustments for the scanner. Third, traditional CD setup and control is based on the focus and dose calculated from their CD response and not from measurement of their effect on pattern profile, which allows a clean and orthogonal de-convolution of focus and dose variations across the wafer. Fourth, scanner setup and control has to take into consideration the final goal of lithography, which is the accurate printing of a complex pattern describing a real device layout. To this end we introduce a new setup and control metrology step: measuring-to-match scanner 1D and 2D proximity. In this paper we will describe the strategy for setup and control of overlay, focus, CD and proximity based on the YieldStarTM metrology tool and present the resulting performance. YieldStar-200 is a new, high throughput metrology tool based on a high numerical aperture scatterometer concept. The tool can be used stand-alone as well as integrated in a processing track. It is suitable for determining process offsets in X,Y and Z directions through Overlay

  9. Evaluation of Free-Riding Traffic Problem in Overlay Routing and Its Mitigation Method

    NASA Astrophysics Data System (ADS)

    Hasegawa, Go; Hiraoka, Yuichiro; Murata, Masayuki

    Recent research on overlay networks has revealed that user-perceived network performance could be improved by an overlay routing mechanism. The effectiveness of overlay routing is mainly a result of the policy mismatch between the overlay routing and the underlay IP routing operated by ISPs. However, this policy mismatch causes a “free-riding” traffic problem, which may become harmful to the cost structure of Internet Service Providers. In the present paper, we define the free-riding problem in the overlay routing and evaluate the degree of free-riding traffic to reveal the effect of the problem on ISPs. We introduce a numerical metric to evaluate the degree of the free-riding problem and confirm that most multihop overlay paths that have better performance than the direct path brings the free-riding problem. We also discuss the guidelines for selecting paths that are more effective than the direct path and that mitigate the free-riding problem.

  10. Ductile film delamination from compliant substrates using hard overlayers

    PubMed Central

    Cordill, M.J.; Marx, V.M.; Kirchlechner, C.

    2014-01-01

    Flexible electronic devices call for copper and gold metal films to adhere well to polymer substrates. Measuring the interfacial adhesion of these material systems is often challenging, requiring the formulation of different techniques and models. Presented here is a strategy to induce well defined areas of delamination to measure the adhesion of copper films on polyimide substrates. The technique utilizes a stressed overlayer and tensile straining to cause buckle formation. The described method allows one to examine the effects of thin adhesion layers used to improve the adhesion of flexible systems. PMID:25641995

  11. Bandwidth auction for SVC streaming in dynamic multi-overlay

    NASA Astrophysics Data System (ADS)

    Xiong, Yanting; Zou, Junni; Xiong, Hongkai

    2010-07-01

    In this paper, we study the optimal bandwidth allocation for scalable video coding (SVC) streaming in multiple overlays. We model the whole bandwidth request and distribution process as a set of decentralized auction games between the competing peers. For the upstream peer, a bandwidth allocation mechanism is introduced to maximize the aggregate revenue. For the downstream peer, a dynamic bidding strategy is proposed. It achieves maximum utility and efficient resource usage by collaborating with a content-aware layer dropping/adding strategy. Also, the convergence of the proposed auction games is theoretically proved. Experimental results show that the auction strategies can adapt to dynamic join of competing peers and video layers.

  12. Effect of a Dielectric Overlay on a Linearly Tapered Slot Antenna Excited by a Coplanar Waveguide

    NASA Technical Reports Server (NTRS)

    Simons, Rainee N.; Lee, Richard Q.; Perl, Thomas D.; Silvestro, John

    1993-01-01

    The effect of a dielectric overlay on a linearly tapered slot antenna (LTSA) is studied. The LTSA under study has very wide bandwidth and excellent radiation patterns. A dielectric overlay improves the patterns and directivity of the antenna by increasing the electrical length and effective aperture of the antenna. A dielectric overlay can also be used to reduce the physical length of the antenna without compromising the pattern quality.

  13. Thickness and air voids measurement on asphalt concrete pavements using ground-penetrating radar

    NASA Astrophysics Data System (ADS)

    Dhakal, Sharad Raj

    Layer thickness and air voids are important parameters in quality assurance of newly paved hot mix asphalt (HMA) pavements. A non-destructive testing (NDT) technique was used to collect layer thickness information. The thicknesses estimated by the technique were compared with core thicknesses. Ground penetrating radar (GPR) system with air coupled antennas was used for on-site pavement data collection. Two application softwares - RADAN and ROAD DOCTOR - were used to process the field data for estimating layer thicknesses and air voids along the scanned pavements. 150 mm diameter cores taken from random locations on the pavements were tested in the laboratory to determine layer thickness and air voids. Statistical analyses were conducted to compare thicknesses and generate a regression equation relating air voids and dielectric constant of the pavement material. No significant differences were found between thickness estimates from RADAN and ROAD DOCTOR softwares when compared to the core measurements. However, RADAN and ROAD DOCTOR results are marginally significantly different from each other. ROAD DOCTOR software was used to generate air voids for the pavements scanned. Laboratory results from cores were utilized to determine calibration factors for the air voids -- dielectric equation. A relationship between air voids and dielectric constant is presented. It is concluded that GPR system with air coupled antennas used alongside a reduced core testing has a potential for quality control of newly paved hot mixed asphalt pavements.

  14. Examination of overlay pipe weldments removed from the Hatch-2 reactor

    SciTech Connect

    Park, J.Y.; Kupperman, D.S.; Shack, W.J.

    1985-02-01

    Laboratory ultrasonic examination (UT), dye penetrant examination (PT), metallography, and sensitization measurements were performed on Type 304 stainless steel overlay pipe weldments from the Hatch-2 BWR to determine the effectiveness of UT through overlays and the effects of the overlays on crack propagation in the weldments. Little correlation was observed between the results of earlier in-service ultrasonic inspection and the results of PT and destructive examination. Considerable difficulty was encountered in correctly detecting the presence of cracks by UT in the laboratory. Blunting of the crack tip by the weld overlay was observed, but there was no evidence of tearing or throughwall extension of the crack beyond the blunted region.

  15. Blot overlays with 32P-labeled fusion proteins.

    PubMed

    Zhao, Z; Lim, L; Manser, E

    2001-07-01

    Proteins labeled with 32P can be used as sensitive "prime" in blot overlays to detect binding proteins or domains. Small G-protein Ras can bind GTP with extremely high affinity (Kd approximately 10(-11)-10(-12) M) in the presence of Mg2+. We have taken advantage of this property of Ras to develop a vector that expresses proteins of interest such as glutathione S-transferase (GST)/Ras fusion proteins for noncovalent labeling with [gamma-32P]GTP. The labeling efficiency of this method is >60% and involves a single short incubation step. We have previously identified several binding proteins for the second SH3 domain of the adaptor Nck using this method. Here we illustrate the overlay method using the GST/Ras system and compare results with the SH3 domain labeled by phosphorylation with [gamma-32P]ATP. Both methods are similarly specific and sensitive; however, we show that signals are dependent primarily on GST-mediated probe dimerization. These dimeric probes allow a more stable probe-target complex similar to immunoglobulin interactions, thus significantly improving the sensitivity of the technique. PMID:11403569

  16. Lightweight storage and overlay networks for fault tolerance.

    SciTech Connect

    Oldfield, Ron A.

    2010-01-01

    The next generation of capability-class, massively parallel processing (MPP) systems is expected to have hundreds of thousands to millions of processors, In such environments, it is critical to have fault-tolerance mechanisms, including checkpoint/restart, that scale with the size of applications and the percentage of the system on which the applications execute. For application-driven, periodic checkpoint operations, the state-of-the-art does not provide a scalable solution. For example, on today's massive-scale systems that execute applications which consume most of the memory of the employed compute nodes, checkpoint operations generate I/O that consumes nearly 80% of the total I/O usage. Motivated by this observation, this project aims to improve I/O performance for application-directed checkpoints through the use of lightweight storage architectures and overlay networks. Lightweight storage provide direct access to underlying storage devices. Overlay networks provide caching and processing capabilities in the compute-node fabric. The combination has potential to signifcantly reduce I/O overhead for large-scale applications. This report describes our combined efforts to model and understand overheads for application-directed checkpoints, as well as implementation and performance analysis of a checkpoint service that uses available compute nodes as a network cache for checkpoint operations.

  17. Dynamic bi-overlay rotation for streaming with heterogeneous devices

    NASA Astrophysics Data System (ADS)

    Liu, Dongyu; Chen, Songqing; Shen, Bo

    2008-01-01

    Recently Internet P2P/overlay streaming has gained increasing popularity. While plenty of research has focused on streaming performance study, it is not quite known yet on how to efficiently serve heterogeneous devices that have different limitations on display size, color depth, bandwidth capacities, CPU and battery power, than desktop computers. Although previous work1 proposes to reuse intermediate information (metadata) produced during transcoding to facilitate runtime content adaption to serve heterogeneous clients by reducing total computing load, unbalanced resource contribution may pre-maturely exhaust the limited power of mobile devices, and adversely affect the performance of participating nodes and subsequently threaten the robustness of the whole system. In this work, we propose a Dynamic Bi-Overlay Rotation (DOOR) scheme, in which, we further consider resource consumption of participating nodes to design a dynamic rotation scheme that reacts to dynamic situations and balances across multiple types of resources on individual nodes. Based on the computing load and transcoding quality parameters obtained through real transcoding sessions, we drive large scale simulations to evaluate DOOR. The results show clear improvement of DOOR over earlier work.

  18. Assessment of in-situ compaction degree of HMA pavement surface layers using GPR and novel dielectric properties-based algorithms

    NASA Astrophysics Data System (ADS)

    Georgiou, Panos; Loizos, Fokion

    2015-04-01

    Field compaction of asphalt pavements is ultimately conducted to achieve layer(s) with suitable mechanical stability. However, the achieved degree of compaction has a significant influence on the performance of asphalt pavements. Providing all desirable mixture design characteristics without adequate compaction could lead to premature permanent deformation, excessive aging, and moisture damage; these distresses reduce the useful life of asphalt pavements. Hence, proper construction of an asphalt pavement is necessary to develop a long lasting roadway that will help minimize future maintenance. This goal is achieved by verifying and confirming that design specifications, in this case density specifications are met through the use of Quality Assurance (QA) practices. With respect to in-situ compaction degree of hot mix asphalt (HMA) pavement surface layers, nearly all agencies specify either cored samples or nuclear/ non nuclear density gauges to provide density measurement of the constructed pavement. Typically, a small number of spot tests (with either cores or nuclear gauges) are run and a judgment about the density level of the entire roadway is made based on the results of this spot testing. Unfortunately, density measurement from a small number of spots may not be representative of the density of the pavement mat. Hence, full coverage evaluation of compaction quality of the pavement mat is needed. The Ground Penetrating Radar (GPR), as a Non Destructive Testing (NDT) technique, is an example of a non-intrusive technique that favors over the methods mentioned above for assessing compaction quality of asphalt pavements, since it allows measurement of all mat areas. Further, research studies in recent years have shown promising results with respect to its capability, coupled with the use of novel algorithms based on the dielectric properties of HMA, to predict the in-situ field density. In view of the above, field experimental surveys were conducted to assess the

  19. Virtual overlay metrology for fault detection supported with integrated metrology and machine learning

    NASA Astrophysics Data System (ADS)

    Lee, Hong-Goo; Schmitt-Weaver, Emil; Kim, Min-Suk; Han, Sang-Jun; Kim, Myoung-Soo; Kwon, Won-Taik; Park, Sung-Ki; Ryan, Kevin; Theeuwes, Thomas; Sun, Kyu-Tae; Lim, Young-Wan; Slotboom, Daan; Kubis, Michael; Staecker, Jens

    2015-03-01

    While semiconductor manufacturing moves toward the 7nm node for logic and 15nm node for memory, an increased emphasis has been placed on reducing the influence known contributors have toward the on product overlay budget. With a machine learning technique known as function approximation, we use a neural network to gain insight to how known contributors, such as those collected with scanner metrology, influence the on product overlay budget. The result is a sufficiently trained function that can approximate overlay for all wafers exposed with the lithography system. As a real world application, inline metrology can be used to measure overlay for a few wafers while using the trained function to approximate overlay vector maps for the entire lot of wafers. With the approximated overlay vector maps for all wafers coming off the track, a process engineer can redirect wafers or lots with overlay signatures outside the standard population to offline metrology for excursion validation. With this added flexibility, engineers will be given more opportunities to catch wafers that need to be reworked, resulting in improved yield. The quality of the derived corrections from measured overlay metrology feedback can be improved using the approximated overlay to trigger, which wafers should or shouldn't be, measured inline. As a development or integration engineer the approximated overlay can be used to gain insight into lots and wafers used for design of experiments (DOE) troubleshooting. In this paper we will present the results of a case study that follows the machine learning function approximation approach to data analysis, with production overlay measured on an inline metrology system at SK hynix.

  20. Questioning the Benefits That Coloured Overlays Can Have for Reading in Students with and without Dyslexia

    ERIC Educational Resources Information Center

    Henderson, Lisa M.; Tsogka, Natassa; Snowling, Margaret J.

    2013-01-01

    Visual stress (the experience of visual distortions and discomfort during prolonged reading) is frequently identified and alleviated with coloured overlays or lenses. Previous studies have associated visual stress with dyslexia and as a consequence, coloured overlays are widely distributed to children and adults with reading difficulty. However,…

  1. Toward 7nm target on product overlay for C028 FDSOI technology

    NASA Astrophysics Data System (ADS)

    Gatefait, Maxime; Le-Gratiet, Bertrand; Goirand, Pierre Jerome; Lam, Auguste; Van Haren, Richard; Pastol, Anne; Doytcheva, Maya; Liu, Xing Lan; Beltman, Jan

    2013-04-01

    The continuous need for lithography overlay performance improvement is a key point for advanced integrated circuit manufacturing. Overlay control is more and more challenging in the 2x nm process nodes regarding functionality margin of the chip and tool capability. Transistor architecture rules which are set, confirm poly to contact space as the most critical one for 28nm technology node. Critical Dimension variability of these layers, even with best in class process stability, in addition to design constraint lead to on product overlay specifications of around 7nm. In order to ensure that the target is met in production environment and to identify potential ways for improvement, identification of the contributors to overlay errors is essential. We have introduced a novel budget breakdown methodology using both bottom-up and top-down overlay data. For the bottom up part, we have performed extensive testing with very high sampling scheme so as to quantify the main effects. In-line overlay metrology data has been used for top down approach to verify the overall performance in production. In this paper we focused on the 28nm contact to gate overlay in a FDSOI process. The initial inconsistency between bottom up and top down results led us to further exploration of the root cause of these inconsistencies. We have been able to highlight key figures to focus on, like reticle heating, wafer table contamination and etch processing effects. Finally, we conclude on 7nm overlay target achievement feasibility in high volume manufacturing environment.

  2. Sol-Gel-Based Titania-Silica Thin Film Overlay for Long Period Fiber Grating-Based Biosensors.

    PubMed

    Chiavaioli, Francesco; Biswas, Palas; Trono, Cosimo; Jana, Sunirmal; Bandyopadhyay, Somnath; Basumallick, Nandini; Giannetti, Ambra; Tombelli, Sara; Bera, Susanta; Mallick, Aparajita; Baldini, Francesco

    2015-12-15

    An evanescent wave optical fiber biosensor based on titania-silica-coated long period grating (LPG) is presented. The chemical overlay, which increases the refractive index (RI) sensitivity of the sensor, consists of a sol-gel-based titania-silica thin film, deposited along the sensing portion of the fiber by means of the dip-coating technique. Changing both the sol viscosity and the withdrawal speed during the dip-coating made it possible to adjust the thickness of the film overlay, which is a crucial parameter for the sensor performance. After the functionalization of the fiber surface using a methacrylic acid/methacrylate copolymer, an antibody/antigen (IgG/anti-IgG) assay was carried out to assess the performance of sol-gel based titania-silica-coated LPGs as biosensors. The analyte concentration was determined from the wavelength shift at the end of the binding process and from the initial binding rate. This is the first time that a sol-gel based titania-silica-coated LPG is proposed as an effective and feasible label-free biosensor. The specificity of the sensor was validated by performing the same model assay after spiking anti-IgG into human serum. With this structured LPG, detection limits of the order of tens of micrograms per liter (10(-11) M) are attained. PMID:26548589

  3. Overlay improvement by exposure map based mask registration optimization

    NASA Astrophysics Data System (ADS)

    Shi, Irene; Guo, Eric; Chen, Ming; Lu, Max; Li, Gordon; Li, Rivan; Tian, Eric

    2015-03-01

    Along with the increased miniaturization of semiconductor electronic devices, the design rules of advanced semiconductor devices shrink dramatically. [1] One of the main challenges of lithography step is the layer-to-layer overlay control. Furthermore, DPT (Double Patterning Technology) has been adapted for the advanced technology node like 28nm and 14nm, corresponding overlay budget becomes even tighter. [2][3] After the in-die mask registration (pattern placement) measurement is introduced, with the model analysis of a KLA SOV (sources of variation) tool, it's observed that registration difference between masks is a significant error source of wafer layer-to-layer overlay at 28nm process. [4][5] Mask registration optimization would highly improve wafer overlay performance accordingly. It was reported that a laser based registration control (RegC) process could be applied after the pattern generation or after pellicle mounting and allowed fine tuning of the mask registration. [6] In this paper we propose a novel method of mask registration correction, which can be applied before mask writing based on mask exposure map, considering the factors of mask chip layout, writing sequence, and pattern density distribution. Our experiment data show if pattern density on the mask keeps at a low level, in-die mask registration residue error in 3sigma could be always under 5nm whatever blank type and related writer POSCOR (position correction) file was applied; it proves random error induced by material or equipment would occupy relatively fixed error budget as an error source of mask registration. On the real production, comparing the mask registration difference through critical production layers, it could be revealed that registration residue error of line space layers with higher pattern density is always much larger than the one of contact hole layers with lower pattern density. Additionally, the mask registration difference between layers with similar pattern density

  4. Decentralized Service Allocation in a Broker Overlay Based Grid

    NASA Astrophysics Data System (ADS)

    Azab, Abdulrahman; Meling, Hein

    Grid computing is based on coordinated resource sharing in a dynamic environment of multi-institutional virtual organizations. Data exchanges, and service allocation, are challenging problems in the field of Grid computing. This is due to the decentralization of Grid systems. Building decentralized Grid systems with efficient resource management and software component mechanisms is a need for achieving the required efficiency and usability of Grid systems. In this work, a decentralized Grid system model is presented in which, the system is divided into virtual organizations each controlled by a broker. An overlay network of brokers is responsible for global resource management and managing allocation of services. Experimental results show that, the system achieves dependable performance with various loads of services, and broker failures.

  5. Extremely fast hydrogen absorption/desorption through platinum overlayers

    NASA Astrophysics Data System (ADS)

    Połczyński, Piotr; Jurczakowski, Rafał

    2016-02-01

    The hydrogen electrosorption in thin palladium films (50-1000 nm) was investigated at palladium electrodes covered with platinum overlayers. The results for this model system show that the rates of the hydrogen sorption/desorption are orders of magnitude higher for platinized samples with respect to pure palladium. The highest absorption kinetics have been observed for Pd electrodes fully covered with 1-3 platinum monolayers. By means of electrochemical impedance spectroscopy (EIS) we have shown that the process is diffusion limited at platinized Pd layers. Diffusion coefficient, DH, determined in EIS, is two orders of magnitude higher than that previously reported for thin palladium films and approaches DH for bulk palladium. The system stability after hydrogen absorption was assessed and the sorption mechanism was discussed. Surprisingly high durability of the platinized palladium enables its use in a variety of applications where fast and selective response in the presence of hydrogen is required.

  6. Exact and reliable overlay metrology in nanoscale semiconductor devices using an image processing method

    NASA Astrophysics Data System (ADS)

    Park, Jinkook; Shin, ChaeHo; Kim, Minkook; Kim, Junghwan; Park, JeongKyun; Kim, JungSoo; Jun, ChungSam; Yim, Yeny; Lee, Janghee

    2014-10-01

    As semiconductor processing becomes more complicated and pattern sizes shrink, the overlay metrology has become one of the most important issues in the semiconductor industry. Therefore, in order to obtain correct, reliable overlay values in semiconductor fabrication facilities (fab), quantization methods for the efficient management and implementation of a measurement algorithm are required, as well as an understanding of the target structures in the semiconductor device. We implemented correct, reliable overlay values in the pattern using the image processing method. The quantization method, through correlation analysis and a new algorithm for target structures, were able to improve the sensitivity to misalignment in the pattern and enable more stable and credible in-line measurement by decreasing the distribution of the residuals in overlay values. Since overlay values of the pattern in the fab were measured and managed more reliably and quickly, it is expected that our study will be able to contribute to the yield enhancement of semiconductor companies.

  7. Integrated production overlay field-by-field control for leading edge technology nodes

    NASA Astrophysics Data System (ADS)

    Chung, Woong Jae; Tristan, John; Gutjahr, Karsten; Subramany, Lokesh; Li, Chen; Sun, Yulei; Yelverton, Mark; Kim, Young Ki; Kim, Jeong Soo; Huang, Chin-Chou Kevin; Pierson, William; Karur-Shanmugam, Ramkumar; Riggs, Brent; Jug, Sven; Robinson, John C.; Yap, Lipkong; Ramanathan, Vidya

    2014-04-01

    As photolithography will continue with 193nm immersion multiple patterning technologies for the leading edge HVM process node, the production overlay requirement for critical layers in logic devices has almost reached the scanner hardware performance limit. To meet the extreme overlay requirements in HVM production environment, this study investigates a new integrated overlay control concept for leading edge technology nodes that combines the run-to-run (R2R) linear or high order control loop, the periodic field-by-field or correction per exposure (CPE) wafer process signature control loop, and the scanner baseline control loop into a single integrated overlay control path through the fab host APC system. The goal is to meet the fab requirements for overlay performance, lower the cost of ownership, and provide freedom of control methodology. In this paper, a detailed implementation of this concept will be discussed, along with some preliminary results.

  8. Fundamentals of overlay measurement and inspection using scanning electron-microscope

    NASA Astrophysics Data System (ADS)

    Kato, T.; Okagawa, Y.; Inoue, O.; Arai, K.; Yamaguchi, S.

    2013-04-01

    Scanning electron-microscope (SEM) has been successfully applied to CD measurement as promising tools for qualifying and controlling quality of semiconductor devices in in-line manufacturing process since 1985. Furthermore SEM is proposed to be applied to in-die overlay monitor in the local area which is too small to be measured by optical overlay measurement tools any more, when the overlay control limit is going to be stringent and have un-ignorable dependence on device pattern layout, in-die location, and singular locations in wafer edge, etc. In this paper, we proposed new overlay measurement and inspection system to make an effective use of in-line SEM image, in consideration of trade-off between measurement uncertainty and measurement pattern density in each SEM conditions. In parallel, we make it clear that the best hybrid overlay metrology is in considering each tool's technology portfolio.

  9. Synchrotron radiation photoemission study of metal overlayers on hydrogenated amorphous silicon at room temperature

    SciTech Connect

    Pi, J.

    1990-09-21

    In this dissertation, metals deposited on a hydrogenated amorphous silicon (a-Si:H) film at room temperature are studied. The purpose of this work is mainly understanding the electronic properties of the interface, using high-resolution synchrotron radiation photoemission techniques as a probe. Atomic hydrogen plays an important role in passivating dangling bonds of a-Si:H films, thus reducing the gap-state distribution. In addition, singly bonded hydrogen also reduces states at the top of the valence band which are now replaced by deeper Si-H bonding states. The interface is formed by evaporating metal on an a-Si:H film in successive accumulations at room temperature. Au, Ag, and Cr were chosen as the deposited metals. Undoped films were used as substrates. Since some unique features can be found in a-Si:H, such as surface enrichment of hydrogen diffused from the bulk and instability of the free surface, we do not expect the metals/a-Si:H interface to behave exactly as its crystalline counterpart. Metal deposits, at low coverages, are found to gather preferentially around regions deficient in hydrogen. As the thickness is increased, some Si atoms in those regions are likely to leave their sites to intermix with metal overlayers like Au and Cr. 129 refs., 30 figs.

  10. Fracture properties of a neutron-irradiated stainless steel submerged arc weld cladding overlay

    SciTech Connect

    Corwin, W.R.; Berggren, R.G.; Nanstad, R.K.

    1984-01-01

    The ability of stainless steel cladding to increase the resistance of an operating nuclear reactor pressure vessel to extension of surface flaws depends greatly on the properties of the irradiated cladding. Therefore, weld overlay cladding irradiated at temperatures and fluences relevant to power reactor operation was examined. The cladding was applied to a pressure vessel steel plate by the submerged arc, single-wire, oscillating-electrode method. Three layers of cladding provided a thickness adequate for fabrication of test specimens. The first layer was type 309, and the upper two layers were type 308 stainless steel. The type 309 was diluted considerably by excessive melting of the base plate. Specimens were taken from near the base plate-cladding interface and also from the upper layers. Charpy V-notch and tensile specimens were irradiated at 288/sup 0/C to a fluence of 2 x 10/sup 23/ neutrons/m/sup 2/ (>1 MeV). 10 refs., 16 figs., 4 tabs.

  11. Diffraction based overlay metrology: accuracy and performance on front end stack

    NASA Astrophysics Data System (ADS)

    Leray, Philippe; Cheng, Shaunee; Kandel, Daniel; Adel, Michael; Marchelli, Anat; Vakshtein, Irina; Vasconi, Mauro; Salski, Bartlomiej

    2008-03-01

    The overlay metrology budget is typically 1/10 of the overlay control budget resulting in overlay metrology total measurement uncertainty requirements of 0.57 nm for the most challenging use cases of the 32nm technology generation. Theoretical considerations show that overlay technology based on differential signal scatterometry (SCOL TM) has inherent advantages, which will allow it to achieve the 32nm technology generation requirements and go beyond it. In this work we present results of an experimental and theoretical study of SCOL. We present experimental results, comparing this technology with the standard imaging overlay metrology. In particular, we present performance results, such as precision and tool induced shift, for different target designs. The response to a large range of induced misalignment is also shown. SCOL performance on these targets for a real stack is reported. We also show results of simulations of the expected accuracy and performance associated with a variety of scatterometry overlay target designs. The simulations were carried out on several stacks including FEOL and BEOL materials. The inherent limitations and possible improvements of the SCOL technology are discussed. We show that with the appropriate target design and algorithms, scatterometry overlay achieves the accuracy required for future technology generations.

  12. High-frequency permeability and permittivity of Ni xZn (1-x)Fe 2O 4 thick film

    NASA Astrophysics Data System (ADS)

    Kulkarni, D. C.; Lonkar, U. B.; Puri, Vijaya

    Magnetic materials such as Ni xZn (1-x)Fe 2O 4 have resonant frequency in high frequency; therefore, they are more useful especially in microwaves. The Ni xZn (1-x)Fe 2O 4 was prepared by the chemical coprecipitation method using citrate precursors, and the fritless thick film was screen printed on alumina substrates. The composition-dependent permeability and permittivity in the high frequency 8-12 GHz are investigated. Using the overlay technique on Ag-thick-film patch antenna, the change in reflectance and transmittance has been measured. The Ni xZn (1-x)Fe 2O 4 thick film, when used as overlay on Ag-thick-film patch antenna, changes the resonance characteristics. The changes in resonance frequency, reflectance and transmittance have been used to calculate the permeability and permittivity of the thick film. Zinc-concentration-dependent changes are obtained.

  13. Augmented Endoscopic Images Overlaying Shape Changes in Bone Cutting Procedures.

    PubMed

    Nakao, Megumi; Endo, Shota; Nakao, Shinichi; Yoshida, Munehito; Matsuda, Tetsuya

    2016-01-01

    In microendoscopic discectomy for spinal disorders, bone cutting procedures are performed in tight spaces while observing a small portion of the target structures. Although optical tracking systems are able to measure the tip of the surgical tool during surgery, the poor shape information available during surgery makes accurate cutting difficult, even if preoperative computed tomography and magnetic resonance images are used for reference. Shape estimation and visualization of the target structures are essential for accurate cutting. However, time-varying shape changes during cutting procedures are still challenging issues for intraoperative navigation. This paper introduces a concept of endoscopic image augmentation that overlays shape changes to support bone cutting procedures. This framework handles the history of the location of the measured drill tip as a volume label and visualizes the remains to be cut overlaid on the endoscopic image in real time. A cutting experiment was performed with volunteers, and the feasibility of this concept was examined using a clinical navigation system. The efficacy of the cutting aid was evaluated with respect to the shape similarity, total moved distance of a cutting tool, and required cutting time. The results of the experiments showed that cutting performance was significantly improved by the proposed framework. PMID:27584732

  14. Deployable Overlay Network for Defense against Distributed SYN Flood Attacks

    NASA Astrophysics Data System (ADS)

    Ohsita, Yuichi; Ata, Shingo; Murata, Masayuki

    Distributed denial-of-service attacks on public servers have recently become more serious. Most of them are SYN flood attacks, since the malicious attackers can easily exploit the TCP specification to generate traffic making public servers unavailable. We need a defense method which can protect legitimate traffic so that end users can connect the target servers during such attacks. In this paper, we propose a new framework, in which all of the TCP connections to the victim servers from a domain are maintained at the gateways of the domain (i. e., near the clients). We call the nodes maintaining the TCP connection defense nodes. The defense nodes check whether arriving packets are legitimate or not by maintaining the TCP connection. That is, the defense nodes delegate reply packets to the received connection request packets and identify the legitimate packets by checking whether the clients reply to the reply packets. Then, only identified traffic are relayed via overlay networks. As a result, by deploying the defense nodes at the gateways of a domain, the legitimate packets from the domain are relayed apart from other packets including attack packets and protected. Our simulation results show that our method can protect legitimate traffic from the domain deploying our method. We also describe the deployment scenario of our defense mechanism.

  15. Ultrasonic Evaluation of Two Dissimilar Metal Weld Overlay Specimens

    SciTech Connect

    Crawford, Susan L.; Cinson, Anthony D.; Prowant, Matthew S.; Moran, Traci L.; Anderson, Michael T.

    2012-06-30

    Two dissimilar metal weld (DMW) pipe-to-nozzle specimens were implanted with thermal fatigue cracks in the 13% to 90% through-wall depth range. The specimens were ultrasonically evaluated with phased-array probes having center frequencies of 0.8, 1.0, 1.5, and 2.0 megahertz (MHz). An Alloy 82/182 weld overlay (WOL) was applied and the specimens were ultrasonically re-evaluated for flaw detection and characterization. The Post-WOL flaw depths were approximately 10% to 56% through-wall. This study has shown the effectiveness of ultrasonic examinations of Alloy 82/182 overlaid DMW specimens. Phased-array probes with center frequency in the 0.8- to 1.0-MHz range provide a strong coherent signal but the greater ultrasonic wavelength and larger beam spot size prevent the reliable detection of small flaws. These small flaws had nominal through-wall depths of less than 15% and length in the 50-60 mm (2-2.4 in.) range. Flaws in the 19% and greater through-wall depth range were readily detected with all four probes. At the higher frequencies, the reflected signals are less coherent but still provide adequate signal for flaw detection and characterization. A single inspection at 2.0 MHz could provide adequate detection and sizing information but a supplemental inspection at 1.0 or 1.5 MHz is recommended.

  16. Quality metric for accurate overlay control in <20nm nodes

    NASA Astrophysics Data System (ADS)

    Klein, Dana; Amit, Eran; Cohen, Guy; Amir, Nuriel; Har-Zvi, Michael; Huang, Chin-Chou Kevin; Karur-Shanmugam, Ramkumar; Pierson, Bill; Kato, Cindy; Kurita, Hiroyuki

    2013-04-01

    The semiconductor industry is moving toward 20nm nodes and below. As the Overlay (OVL) budget is getting tighter at these advanced nodes, the importance in the accuracy in each nanometer of OVL error is critical. When process owners select OVL targets and methods for their process, they must do it wisely; otherwise the reported OVL could be inaccurate, resulting in yield loss. The same problem can occur when the target sampling map is chosen incorrectly, consisting of asymmetric targets that will cause biased correctable terms and a corrupted wafer. Total measurement uncertainty (TMU) is the main parameter that process owners use when choosing an OVL target per layer. Going towards the 20nm nodes and below, TMU will not be enough for accurate OVL control. KLA-Tencor has introduced a quality score named `Qmerit' for its imaging based OVL (IBO) targets, which is obtained on the-fly for each OVL measurement point in X & Y. This Qmerit score will enable the process owners to select compatible targets which provide accurate OVL values for their process and thereby improve their yield. Together with K-T Analyzer's ability to detect the symmetric targets across the wafer and within the field, the Archer tools will continue to provide an independent, reliable measurement of OVL error into the next advanced nodes, enabling fabs to manufacture devices that meet their tight OVL error budgets.

  17. 64nm pitch metal1 double patterning metrology: CD and OVL control by SEMCD, image based overlay and diffraction based overlay

    NASA Astrophysics Data System (ADS)

    Ducoté, Julien; Dettoni, Florent; Bouyssou, Régis; Le-Gratiet, Bertrand; Carau, Damien; Dezauzier, Christophe

    2015-03-01

    Patterning process control of advanced nodes has required major changes over the last few years. Process control needs of critical patterning levels since 28nm technology node is extremely aggressive showing that metrology accuracy/sensitivity must be finely tuned. The introduction of pitch splitting (Litho-Etch-Litho-Etch) at 14FDSOInm node requires the development of specific metrologies to adopt advanced process control (for CD, overlay and focus corrections). The pitch splitting process leads to final line CD uniformities that are a combination of the CD uniformities of the two exposures, while the space CD uniformities are depending on both CD and OVL variability. In this paper, investigations of CD and OVL process control of 64nm minimum pitch at Metal1 level of 14FDSOI technology, within the double patterning process flow (Litho, hard mask etch, line etch) are presented. Various measurements with SEMCD tools (Hitachi), and overlay tools (KT for Image Based Overlay - IBO, and ASML for Diffraction Based Overlay - DBO) are compared. Metrology targets are embedded within a block instanced several times within the field to perform intra-field process variations characterizations. Specific SEMCD targets were designed for independent measurement of both line CD (A and B) and space CD (A to B and B to A) for each exposure within a single measurement during the DP flow. Based on those measurements correlation between overlay determined with SEMCD and with standard overlay tools can be evaluated. Such correlation at different steps through the DP flow is investigated regarding the metrology type. Process correction models are evaluated with respect to the measurement type and the intra-field sampling.

  18. The Effect of Colored Overlays on Reading Fluency in Individuals with Dyslexia.

    PubMed

    Denton, Tiffany Freeze; Meindl, James N

    2016-09-01

    Colored overlays, one type of tinted filter, are plastic reading sheets tinted with color and placed over text to eliminate or alleviate a wide range of reading difficulties such as low reading rate, accuracy, and comprehension. The effects of colored overlays on reading problems associated with dyslexia were investigated in this study via a multielement design. Reading fluency was assessed when participants read with and without colored overlays. Undifferentiated responding, or decreased accuracy, resulted across three participants, suggesting that colored overlays were ineffective and potentially detrimental to participants' reading abilities. As a result, empirically validated reading techniques were implemented across individuals. These findings are discussed and recommendations are made in regards to the use of research-based reading interventions. PMID:27622123

  19. Characterisation of hydrocarbonaceous overlayers important in metal-catalysed selective hydrogenation reactions

    NASA Astrophysics Data System (ADS)

    Lennon, David; Warringham, Robbie; Guidi, Tatiana; Parker, Stewart F.

    2013-12-01

    The hydrogenation of alkynes to alkenes over supported metal catalysts is an important industrial process and it has been shown that hydrocarbonaceous overlayers are important in controlling selectivity profiles of metal-catalysed hydrogenation reactions. As a model system, we have selected propyne hydrogenation over a commercial Pd(5%)/Al2O3 catalyst. Inelastic neutron scattering studies show that the C-H stretching mode ranges from 2850 to 3063 cm-1, indicating the mostly aliphatic nature of the overlayer and this is supported by the quantification of the carbon and hydrogen on the surface. There is also a population of strongly hydrogen-bonded hydroxyls, their presence would indicate that the overlayer probably contains some oxygen functionality. There is little evidence for any olefinic or aromatic species. This is distinctly different from the hydrogen-poor overlayers that are deposited on Ni/Al2O3 catalysts during methane reforming.

  20. Computerized polar plots by a cathode ray tube/grid overlay method

    NASA Technical Reports Server (NTRS)

    Freeman, J. M.; Shoup, E. L.

    1970-01-01

    Overlay is aligned with four calibration dots so it is not affected by CRT drift or changes in vertical or horizontal gain when producing Nyquist /frequency-response phase/amplitude/ plots. Method produces over 50 plots per hour.

  1. Application of overlay modeling and control with Zernike polynomials in an HVM environment

    NASA Astrophysics Data System (ADS)

    Ju, JaeWuk; Kim, MinGyu; Lee, JuHan; Nabeth, Jeremy; Jeon, Sanghuck; Heo, Hoyoung; Robinson, John C.; Pierson, Bill

    2016-03-01

    Shrinking technology nodes and smaller process margins require improved photolithography overlay control. Generally, overlay measurement results are modeled with Cartesian polynomial functions for both intra-field and inter-field models and the model coefficients are sent to an advanced process control (APC) system operating in an XY Cartesian basis. Dampened overlay corrections, typically via exponentially or linearly weighted moving average in time, are then retrieved from the APC system to apply on the scanner in XY Cartesian form for subsequent lot exposure. The goal of the above method is to process lots with corrections that target the least possible overlay misregistration in steady state as well as in change point situations. In this study, we model overlay errors on product using Zernike polynomials with same fitting capability as the process of reference (POR) to represent the wafer-level terms, and use the standard Cartesian polynomials to represent the field-level terms. APC calculations for wafer-level correction are performed in Zernike basis while field-level calculations use standard XY Cartesian basis. Finally, weighted wafer-level correction terms are converted to XY Cartesian space in order to be applied on the scanner, along with field-level corrections, for future wafer exposures. Since Zernike polynomials have the property of being orthogonal in the unit disk we are able to reduce the amount of collinearity between terms and improve overlay stability. Our real time Zernike modeling and feedback evaluation was performed on a 20-lot dataset in a high volume manufacturing (HVM) environment. The measured on-product results were compared to POR and showed a 7% reduction in overlay variation including a 22% terms variation. This led to an on-product raw overlay Mean + 3Sigma X&Y improvement of 5% and resulted in 0.1% yield improvement.

  2. Live 3D image overlay for arterial duct closure with Amplatzer Duct Occluder II additional size.

    PubMed

    Goreczny, Sebstian; Morgan, Gareth J; Dryzek, Pawel

    2016-03-01

    Despite several reports describing echocardiography for the guidance of ductal closure, two-dimensional angiography remains the mainstay imaging tool; three-dimensional rotational angiography has the potential to overcome some of the drawbacks of standard angiography, and reconstructed image overlay provides reliable guidance for device placement. We describe arterial duct closure solely from venous approach guided by live three-dimensional image overlay. PMID:26358032

  3. Assessment and prediction of drying shrinkage cracking in bonded mortar overlays

    SciTech Connect

    Beushausen, Hans Chilwesa, Masuzyo

    2013-11-15

    Restrained drying shrinkage cracking was investigated on composite beams consisting of substrate concrete and bonded mortar overlays, and compared to the performance of the same mortars when subjected to the ring test. Stress development and cracking in the composite specimens were analytically modeled and predicted based on the measurement of relevant time-dependent material properties such as drying shrinkage, elastic modulus, tensile relaxation and tensile strength. Overlay cracking in the composite beams could be very well predicted with the analytical model. The ring test provided a useful qualitative comparison of the cracking performance of the mortars. The duration of curing was found to only have a minor influence on crack development. This was ascribed to the fact that prolonged curing has a beneficial effect on tensile strength at the onset of stress development, but is in the same time not beneficial to the values of tensile relaxation and elastic modulus. -- Highlights: •Parameter study on material characteristics influencing overlay cracking. •Analytical model gives good quantitative indication of overlay cracking. •Ring test presents good qualitative indication of overlay cracking. •Curing duration has little effect on overlay cracking.

  4. VMCast: A VM-Assisted Stability Enhancing Solution for Tree-Based Overlay Multicast

    PubMed Central

    Gu, Weidong; Zhang, Xinchang; Gong, Bin; Zhang, Wei; Wang, Lu

    2015-01-01

    Tree-based overlay multicast is an effective group communication method for media streaming applications. However, a group member’s departure causes all of its descendants to be disconnected from the multicast tree for some time, which results in poor performance. The above problem is difficult to be addressed because overlay multicast tree is intrinsically instable. In this paper, we proposed a novel stability enhancing solution, VMCast, for tree-based overlay multicast. This solution uses two types of on-demand cloud virtual machines (VMs), i.e., multicast VMs (MVMs) and compensation VMs (CVMs). MVMs are used to disseminate the multicast data, whereas CVMs are used to offer streaming compensation. The used VMs in the same cloud datacenter constitute a VM cluster. Each VM cluster is responsible for a service domain (VMSD), and each group member belongs to a specific VMSD. The data source delivers the multicast data to MVMs through a reliable path, and MVMs further disseminate the data to group members along domain overlay multicast trees. The above approach structurally improves the stability of the overlay multicast tree. We further utilized CVM-based streaming compensation to enhance the stability of the data distribution in the VMSDs. VMCast can be used as an extension to existing tree-based overlay multicast solutions, to provide better services for media streaming applications. We applied VMCast to two application instances (i.e., HMTP and HCcast). The results show that it can obviously enhance the stability of the data distribution. PMID:26562152

  5. Mix-and-match overlay performance of the NSR-S622D immersion scanner

    NASA Astrophysics Data System (ADS)

    Makino, Katsushi; Kikuchi, Takahisa; Sasamoto, Satoru; Hongki, Park; Mori, Akiko; Takahashi, Nobuyuki; Wakamoto, Shinji

    2013-04-01

    Current technology nodes, as well as subsequent generations necessitate ongoing improvements to the mix-and-match overlay (MMO) capabilities of lithography scanners. This work will introduce newly developed scanner solutions to address this requirement, and performance data from the latest generation immersion scanner, the NSR-S622D, will be introduced. Enhanced MMO accuracy is imperative for the 22 nm half-pitch and future technology nodes. In order for the matched overlay accuracy to approach single machine overlay (SMO) capabilities, MMO errors must be reduced further. The dominant MMO error sources can be divided into three main areas: SMO, lens distortion matching and wafer grid matching. Nikon continues to decrease these matching error contributors over time, and the latest generation NSRS622D immersion scanner provides a number of innovative solutions to satisfy the most demanding overlay matching requirements ; as a result MMO performance within 3nm is achieved on S622D. Moreover, overlay master system is developed for further product overlay accuracy and stability improvement.

  6. Application Oriented Flow Routing Algorithm for VoIP Overlay Networks

    NASA Astrophysics Data System (ADS)

    Wipusitwarakun, Komwut; Chimmanee, Sanon

    Overlay networks which are dynamically created over underlying IP networks are becoming widely used for delivering multimedia contents since they can provide several additional user-definable services. Multiple overlay paths between a source-destination overlay node pair are designed to improve service robustness against failures and bandwidth fluctuation of the underlying networks. Multimedia traffic can be distributed over those multiple paths in order to maximize paths' utilization and to increase application throughputs. Most of flow-based routing algorithms consider only common metrics such as paths' bandwidth or delay, which may be effective for data applications but not for real-time applications such as Voice over IP (VoIP), in which different levels of such performance metrics may give the same level of the performance experienced by end users. This paper focuses on such VoIP overlay networks and proposes a novel alternative path based flow routing algorithm using an application-specific traffic metric, i.e. “VoIP Path Capacity (VPCap), ” to calculate the maximum number of QoS satisfied VoIP flows which may be distributed over each available overlay path at a moment. The simulation results proved that more QoS-satisfied VoIP sessions can be established over the same multiple overlay paths, comparing to traditional approaches.

  7. VMCast: A VM-Assisted Stability Enhancing Solution for Tree-Based Overlay Multicast.

    PubMed

    Gu, Weidong; Zhang, Xinchang; Gong, Bin; Zhang, Wei; Wang, Lu

    2015-01-01

    Tree-based overlay multicast is an effective group communication method for media streaming applications. However, a group member's departure causes all of its descendants to be disconnected from the multicast tree for some time, which results in poor performance. The above problem is difficult to be addressed because overlay multicast tree is intrinsically instable. In this paper, we proposed a novel stability enhancing solution, VMCast, for tree-based overlay multicast. This solution uses two types of on-demand cloud virtual machines (VMs), i.e., multicast VMs (MVMs) and compensation VMs (CVMs). MVMs are used to disseminate the multicast data, whereas CVMs are used to offer streaming compensation. The used VMs in the same cloud datacenter constitute a VM cluster. Each VM cluster is responsible for a service domain (VMSD), and each group member belongs to a specific VMSD. The data source delivers the multicast data to MVMs through a reliable path, and MVMs further disseminate the data to group members along domain overlay multicast trees. The above approach structurally improves the stability of the overlay multicast tree. We further utilized CVM-based streaming compensation to enhance the stability of the data distribution in the VMSDs. VMCast can be used as an extension to existing tree-based overlay multicast solutions, to provide better services for media streaming applications. We applied VMCast to two application instances (i.e., HMTP and HCcast). The results show that it can obviously enhance the stability of the data distribution. PMID:26562152

  8. Improving overlay control through proper use of multilevel query APC

    NASA Astrophysics Data System (ADS)

    Conway, Timothy H.; Carlson, Alan; Crow, David A.

    2003-06-01

    Many state-of-the-art fabs are operating with increasingly diversified product mixes. For example, at Cypress Semiconductor, it is not unusual to be concurrently running multiple technologies and many devices within each technology. This diverse product mix significantly increases the difficulty of manually controlling overlay process corrections. As a result, automated run-to-run feedforward-feedback control has become a necessary and vital component of manufacturing. However, traditional run-to-run controllers rely on highly correlated historical events to forecast process corrections. For example, the historical process events typically are constrained to match the current event for exposure tool, device, process level and reticle ID. This narrowly defined process stream can result in insufficient data when applied to lowvolume or new-release devices. The run-to-run controller implemented at Cypress utilizes a multi-level query (Level-N) correlation algorithm, where each subsequent level widens the search criteria for available historical data. The paper discusses how best to widen the search criteria and how to determine and apply a known bias to account for tool-to-tool and device-to-device differences. Specific applications include offloading lots from one tool to another when the first tool is down for preventive maintenance, utilizing related devices to determine a default feedback vector for new-release devices, and applying bias values to account for known reticle-to-reticle differences. In this study, we will show how historical data can be leveraged from related devices or tools to overcome the limitations of narrow process streams. In particular, this paper discusses how effectively handling narrow process streams allows Cypress to offload lots from a baseline tool to an alternate tool.

  9. Effects of thermal aging and neutron irradiation on the mechanical properties of stainless steel weld overlay cladding

    SciTech Connect

    Haggag, F.M.; Nanstad, R.K.

    1991-01-01

    Stainless steel weld overlay cladding was fabricated using the three-wire, series-arc method. Three layers of cladding were applied to a pressure vessel plate to provide adequate thickness for fabrication of test specimens. Since irradiation of the stainless steel cladding to 5 {times} 10{sup 19} neutrons/cm{sup 2} (>1 MeV) was conducted at 288{degrees}C for 1605 h, tensile, Charpy V-notch (CVN), precracked Charpy V-notch (PCVN), and compact fracture toughness specimens were thermally aged at 288{degrees}C for 1605 h. Additional specimens are being aged to 20,000 and 50,000 h. Thermal aging of three-wire, series-arc stainless steel weld overlay cladding at 288{degrees}C for 1604 h resulted in appreciable decrease (16%) in the CVN upper-shelf energy, but the effect on the 41-J transition temperature shift was very small (3{degrees}C). The combined effect, following neutron irradiation at 288{degrees}C to a fluence of 5 {times} 10{sup 19} neutrons/cm{sup 2} (>MeV), was a 22% reduction in the CVN upper-shelf energy and a 29{degrees}C shift at the 41-J level. The effect of thermal aging on tensile properties was very small or negligible. However, the combined effect after neutron irradiation was an increase in the yield strength (6 to 34% at test temperatures from 288 to {minus}125{degrees}C) and no apparent change in ultimate strength and total elongation. Also, neutron irradiation reduced the initiation fracture toughness (J{sub Ic}) much more than did thermal aging. However, irradiation slightly decreased the tearing modulus, but no reduction was caused by thermal aging alone. The effects of long-term thermal exposure times (20,000 and 50,000 h) will be investigated when the specimen become available.

  10. Effects of thermal aging and neutron irradiation on the mechanical properties of stainless steel weld overlay cladding

    SciTech Connect

    Haggag, F.M.; Nanstad, R.K.

    1991-12-31

    Stainless steel weld overlay cladding was fabricated using the three-wire, series-arc method. Three layers of cladding were applied to a pressure vessel plate to provide adequate thickness for fabrication of test specimens. Since irradiation of the stainless steel cladding to 5 {times} 10{sup 19} neutrons/cm{sup 2} (>1 MeV) was conducted at 288{degrees}C for 1605 h, tensile, Charpy V-notch (CVN), precracked Charpy V-notch (PCVN), and compact fracture toughness specimens were thermally aged at 288{degrees}C for 1605 h. Additional specimens are being aged to 20,000 and 50,000 h. Thermal aging of three-wire, series-arc stainless steel weld overlay cladding at 288{degrees}C for 1604 h resulted in appreciable decrease (16%) in the CVN upper-shelf energy, but the effect on the 41-J transition temperature shift was very small (3{degrees}C). The combined effect, following neutron irradiation at 288{degrees}C to a fluence of 5 {times} 10{sup 19} neutrons/cm{sup 2} (>MeV), was a 22% reduction in the CVN upper-shelf energy and a 29{degrees}C shift at the 41-J level. The effect of thermal aging on tensile properties was very small or negligible. However, the combined effect after neutron irradiation was an increase in the yield strength (6 to 34% at test temperatures from 288 to {minus}125{degrees}C) and no apparent change in ultimate strength and total elongation. Also, neutron irradiation reduced the initiation fracture toughness (J{sub Ic}) much more than did thermal aging. However, irradiation slightly decreased the tearing modulus, but no reduction was caused by thermal aging alone. The effects of long-term thermal exposure times (20,000 and 50,000 h) will be investigated when the specimen become available.

  11. Capability for Fine Tuning of the Refractive Index Sensing Properties of Long-Period Gratings by Atomic Layer Deposited Al2O3 Overlays

    PubMed Central

    Śmietana, Mateusz; Myśliwiec, Marcin; Mikulic, Predrag; Witkowski, Bartłomiej S.; Bock, Wojtek J.

    2013-01-01

    This work presents an application of thin aluminum oxide (Al2O3) films obtained using atomic layer deposition (ALD) for fine tuning the spectral response and refractive-index (RI) sensitivity of long-period gratings (LPGs) induced in optical fibers. The technique allows for an efficient and well controlled deposition at monolayer level (resolution ∼ 0.12 nm) of excellent quality nano-films as required for optical sensors. The effect of Al2O3 deposition on the spectral properties of the LPGs is demonstrated experimentally and numerically. We correlated both the increase in Al2O3 thickness and changes in optical properties of the film with the shift of the LPG resonance wavelength and proved that similar films are deposited on fibers and oxidized silicon reference samples in the same process run. Since the thin overlay effectively changes the distribution of the cladding modes and thus also tunes the device's RI sensitivity, the tuning can be simply realized by varying number of cycles, which is proportional to thickness of the high-refractive-index (n > 1.6 in infrared spectral range) Al2O3 film. The advantage of this approach is the precision in determining the film properties resulting in RI sensitivity of the LPGs. To the best of our knowledge, this is the first time that an ultra-precise method for overlay deposition has been applied on LPGs for RI tuning purposes and the results have been compared with numerical simulations based on LP mode approximation.

  12. Chemical states and electrical properties of a high-k metal oxide/silicon interface with oxygen-gettering titanium-metal-overlayer

    SciTech Connect

    Seo, Kang-Ill; Lee, Dong-Ick; Pianetta, Piero; Kim, Hyoungsub; Saraswat, Krishna C.; McIntyre, Paul C.

    2006-10-02

    The authors report on the chemical bonding structure of the HfO{sub 2}/Si (001) stack after the SiO{sub 2} interfacial layer (IL) is partially removed by a reactive titanium metal overlayer. Using synchrotron photoelectron spectroscopy, they found that ultrathin SiO{sub 2}-like IL {approx}6.5 A ring thick, which is significantly less than the initial SiO{sub 2} IL thickness of {approx}15 A ring , exists at the HfO{sub 2}/Si interface with an overlying Ti electrode. The dissociated Si from SiO{sub 2} IL is believed to go onto Si substrate where it regrows epitaxially. The interfacial trap density of the Ti-electrode sample was extracted to be {approx}1.6x10{sup 11} eV{sup -1} cm{sup -2} near the midgap of Si, which was comparable to that of the control sample with W electrode.

  13. Robotic weld overlay coatings for erosion control. Quarterly technical progress report, July--September, 1994

    SciTech Connect

    Levin, B.F.; Dupont, J.N.; Marder, A.R.

    1994-10-26

    Research is presently being conducted to develop a criteria for selecting weld overlay coatings for erosion mitigation in Circulated Fluidized Beds. Initially, eleven weld overlay alloys were selected for erosion testing based upon a literature review. All eleven coatings were deposited on 1018 steel substrates using the plasma arc welding process. Ten samples from each coating were prepared for erosion testing. All selected coatings were erosion tested at 400 C and their erosion resistance was evaluated by determining the steady state erosion rate. In addition, the microstructure of each coating was characterized before and after the erosion tests. No correlations were found between room temperature hardness of the weld overlay coatings and their erosion resistance at elevated temperature. It was suggested that weld overlays mechanical properties such as fracture strength, toughness and work hardening rates may contributed to their erosion resistance. During the previous two quarters the microhardness tests were performed on the eroded samples in order to determine the size of the work hardened zone and the change in the coatings hardness due to erosion. As a result of these measurements it was established that one group of coatings deformed plastically, while another did not. In addition, the measurements of the weld overlays microhardness at 400 C were made. The coatings microhardness at 400 C was plotted versus their volume erosion rates. During the last quarter, erosion tests were performed for Inconel-625, 316L SS, and Iron-Aluminide wrought alloys in order to compare their erosion behavior with similar weld overlays. The results of microhardness profile measurements for all weld overlay coatings were analyzed. The factors that contribute to the erosion resistance of the coatings that deformed plastically are discussed in this progress report.

  14. Evaluation of Tizian overlays by means of a swept source optical coherence tomography system

    NASA Astrophysics Data System (ADS)

    Marcauteanu, Corina; Sinescu, Cosmin; Negrutiu, Meda Lavinia; Stoica, Eniko Tunde; Topala, Florin; Duma, Virgil Florin; Bradu, Adrian; Podoleanu, Adrian Gh.

    2016-03-01

    The teeth affected by pathologic attrition can be restored by a minimally invasive approach, using Tizian overlays. In this study we prove the advantages of a fast swept source (SS) OCT system in the evaluation of Tizian overlays placed in an environment characterized by high occlusal forces. 12 maxillary first premolars were extracted and prepared for overlays. The Tizian overlays were subjected to 3000 alternating cycles of thermo-cycling (from -10°C to +50°C) and to mechanical occlusal overloads (at 800 N). A fast SS OCT system was used to evaluate the Tizian overlays before and after the mechanical and thermal straining. The SS (Axsun Technologies, Billerica, MA) has a central wavelength of 1060 nm, sweeping range of 106 nm (quoted at 10 dB) and a 100 kHz line rate. The depth resolution of the system, measured experimentally in air was 10 μm. The imaging system used for this study offers high spatial resolutions in both directions, transversal and longitudinal of around 10 μm, a high sensitivity, and it is also able to acquire entire tridimensional (3D)/volume reconstructions as fast as 2.5 s. Once the full dataset was acquired, rendered high resolutions en-face projections could be produced. Using them, the overlay (i.e., cement) abutment tooth interfaces were remarked both on B-scans/two-dimensional (2D) sections and in the 3D reconstructions. Using the system several open interfaces were possible to detect. The fast SS OCT system thus proves useful in the evaluation of zirconia reinforced composite overlays, placed in an environment characterized by high occlusal forces.

  15. Asphalt overlay design methods for rigid pavements considering rutting, reflection cracking, and fatigue cracking. Research report September 1996--August 1997

    SciTech Connect

    Cho, Y.H.; Liu, C.; Dossey, T.; McCullough, B.F.

    1998-10-01

    An asphalt concrete pavement (ACP) overlay over a rigid pavement represents a viable rehabilitation strategy. It can provide good serviceability at an initial construction cost that is substantially less than that of a rigid overlay rehabilitation. In addition, ACP overlays require less construction time, which can reduce user costs during construction. However, it may not be the most economical solution for long-term rehabilitation. Because of their relatively short service life, ACP overlays may require maintenance sooner than rigid overlays. And one of the more critical distresses that effectively determine the life span of the structure is reflection cracking. This report investigates alternative strategies that seek to prevent reflection cracking on ACP overlays.

  16. Assessment of the chest wall thickness of the lawrence livermore torso phantom using a voxel image.

    PubMed

    Ahmed, A S M Sabbir; Capello, Kevin; Kramer, Gary H

    2011-06-01

    This paper describes the methodology of measuring the chest wall thickness using the voxel image of the Lawrence Livermore National Lab (LLNL) torso phantom. The LLNL phantom is used as a standard to calibrate a lung counter consisting of a 2 × 2 array of germanium detectors. In general, an average thickness estimated from four counting positions is used as the chest wall thickness for a given overlay plate. For a given overlay, the outer chest surface differs from that of inner one, and the chest wall thickness varies from one position to other. The LLNL phantom with chest plate and C4 overlay plate installed was scanned with a CT (computed tomography) scanner. The image data, collected in DICOM (Digital Imaging and Communication) format, were converted to the MCNP input file by using the Scan2Mcnp program. The MCNP file was visualized and analyzed with the Moritz visual editor. An analytic expression was formulated and solved to calculate the chest wall thickness by using the point detector responses (F 5 tally of MCNP). To map the chest thickness, the entire chest wall was meshed into virtual grids of 1 cm width. A source and detector pair was moved along the inner and outer surface of the chest wall from right to left at different heights from neck to abdomen. For each height (z(k)), (x(i), y(j)) coordinates for the detector source pair were calculated from the visual editor and were scaled on-screen. For each (x(i), y(j), z(k)) position, a mesh thickness was measured from on-screen measurement and by solving the detector responses. The chest wall thicknesses at different positions on the outer surface of the chest were compared and verified using two methods. PMID:22004927

  17. Robotic weld overlay coatings for erosion control. Quarterly technical progress report, January 1994--March 1994

    SciTech Connect

    Levin, B.F.; Dupont, J.N.; Marder, A.R.

    1994-04-21

    The erosion of materials by the impact of solid particles has received increasing attention during the past twenty years. Recently, research has been initiated with the event of advanced coal conversion processes in which erosion plays an important role. The resulting damage, termed Solid Particle Erosion (SPE), is of concern primarily because of the significantly increased operating costs which result in material failures. Reduced power plant efficiency due to solid particle erosion of boiler tubes and waterwalls has led to various methods to combat SPE. One method is to apply coatings to the components subjected to erosive environments. Protective weld overlay coatings are particularly advantageous in terms of coating quality. The weld overlay coatings are essentially immune to spallation due to a strong metallurgical bond with the substrate material. By using powder mixtures, multiple alloys can be mixed in order to achieve the best performance in an erosive environment. However, a review of the literature revealed a lack of information on weld overlay coating performance in erosive environments which makes the selection of weld overlay alloys a difficult task. The objective of this project is to determine the effects of weld overlay coating composition and microstructure on erosion resistance. These results will lead to a better understanding of erosion mitigation in circulated fluidized beds.

  18. Implementation and benefits of advanced process control for lithography CD and overlay

    NASA Astrophysics Data System (ADS)

    Zavyalova, Lena; Fu, Chong-Cheng; Seligman, Gary S.; Tapp, Perry A.; Pol, Victor

    2003-05-01

    Due to the rapidly reduced imaging process windows and increasingly stingent device overlay requirements, sub-130 nm lithography processes are more severely impacted than ever by systamic fault. Limits on critical dimensions (CD) and overlay capability further challenge the operational effectiveness of a mix-and-match environment using multiple lithography tools, as such mode additionally consumes the available error budgets. Therefore, a focus on advanced process control (APC) methodologies is key to gaining control in the lithographic modules for critical device levels, which in turn translates to accelerated yield learning, achieving time-to-market lead, and ultimately a higher return on investment. This paper describes the implementation and unique challenges of a closed-loop CD and overlay control solution in high voume manufacturing of leading edge devices. A particular emphasis has been placed on developing a flexible APC application capable of managing a wide range of control aspects such as process and tool drifts, single and multiple lot excursions, referential overlay control, 'special lot' handling, advanced model hierarchy, and automatic model seeding. Specific integration cases, including the multiple-reticle complementary phase shift lithography process, are discussed. A continuous improvement in the overlay and CD Cpk performance as well as the rework rate has been observed through the implementation of this system, and the results are studied.

  19. In die mask overlay control for 14nm double-patterning lithography

    NASA Astrophysics Data System (ADS)

    Chou, William; Cheng, James; Tseng, Alex C. P.; Wu, J. K.; Chang, Chin Kuei; Cheng, Jeffrey; Lee, Adder; Huang, Chain Ting; Peng, N. T.; Hsu, Simon C. C.; Yu, Chun Chi; Lu, Colbert; Yu, Julia; Craig, Peter; Pollock, Chuck; Ham, Young; McMurran, Jeff

    2015-10-01

    According to the ITRS roadmap, semiconductor industry drives the 193nm lithography to its limits, using techniques like Double Pattern Technology (DPT), Source Mask Optimization (SMO) and Inverse Lithography Technology (ILT). In terms of considering the photomask metrology, full in-die measurement capability is required for registration and overlay control with challenging specifications for repeatability and accuracy. Double patterning using 193nm immersion lithography has been adapted as the solution to enable 14nm technology nodes. The overlay control is one of the key figures for the successful realization of this technology. In addition to the various error contributions from the wafer scanner, the reticles play an important role in terms of considering lithographic process contributed errors. Accurate pattern placement of the features on reticles with a registration error below 4nm is mandatory to keep overall photomask contributions to overlay of sub 20nm logic within the allowed error budget. In this paper, we show in-die registration errors using 14nm DPT product masks, by measuring in-die overlay patterns comparing with regular registration patterns. The mask measurements are used to obtain an accurate model to predict mask contribution on wafer overlay of double patterning technology.

  20. Diffraction-based overlay measurement on dedicated mark using rigorous modeling method

    NASA Astrophysics Data System (ADS)

    Lu, Hailiang; Wang, Fan; Zhang, Qingyun; Chen, Yonghui; Zhou, Chang

    2012-03-01

    Diffraction Based Overlay (DBO) is widely evaluated by numerous authors, results show DBO can provide better performance than Imaging Based Overlay (IBO). However, DBO has its own problems. As well known, Modeling based DBO (mDBO) faces challenges of low measurement sensitivity and crosstalk between various structure parameters, which may result in poor accuracy and precision. Meanwhile, main obstacle encountered by empirical DBO (eDBO) is that a few pads must be employed to gain sufficient information on overlay-induced diffraction signature variations, which consumes more wafer space and costs more measuring time. Also, eDBO may suffer from mark profile asymmetry caused by processes. In this paper, we propose an alternative DBO technology that employs a dedicated overlay mark and takes a rigorous modeling approach. This technology needs only two or three pads for each direction, which is economic and time saving. While overlay measurement error induced by mark profile asymmetry being reduced, this technology is expected to be as accurate and precise as scatterometry technologies.

  1. Compensation of overlay errors due to mask bending and non-flatness for EUV masks

    NASA Astrophysics Data System (ADS)

    Chandhok, Manish; Goyal, Sanjay; Carson, Steven; Park, Seh-Jin; Zhang, Guojing; Myers, Alan M.; Leeson, Michael L.; Kamna, Marilyn; Martinez, Fabian C.; Stivers, Alan R.; Lorusso, Gian F.; Hermans, Jan; Hendrickx, Eric; Govindjee, Sanjay; Brandstetter, Gerd; Laursen, Tod

    2009-03-01

    EUV blank non-flatness results in both out of plane distortion (OPD) and in-plane distortion (IPD) [3-5]. Even for extremely flat masks (~50 nm peak to valley (PV)), the overlay error is estimated to be greater than the allocation in the overlay budget. In addition, due to multilayer and other thin film induced stresses, EUV masks have severe bow (~1 um PV). Since there is no electrostatic chuck to flatten the mask during the e-beam write step, EUV masks are written in a bent state that can result in ~15 nm of overlay error. In this article we present the use of physically-based models of mask bending and non-flatness induced overlay errors, to compensate for pattern placement of EUV masks during the e-beam write step in a process we refer to as E-beam Writer based Overlay error Correction (EWOC). This work could result in less restrictive tolerances for the mask blank non-flatness specs which in turn would result in less blank defects.

  2. Image-based overlay (IBO) target segment design on self-aligned patterning process

    NASA Astrophysics Data System (ADS)

    Ye, Lei; Hu, Huayong; He, Weiming

    2016-03-01

    Self-Aligned Double Patterning (SADP) is widely applied in advanced sub-4X patterning technology, especially for the 1D resolution shrinkage of memory technology. As the application of SADP makes lithography minimum pitch down to half of design pitch with the remaining spacer aside core, its alignment mark and overlay (OVL) mark have to be well-segmented to ensure enough mark contrast. In this paper, we designed two types of image-based overlay (IBO) bar in bar (BIB) OVL target: bar-segmentation and background-segmentation with different duty ratio. Based on these two designed types of marks, we focus on the OVL of 2nd photo layer to 1st SADP layer with the core removed (which means spacer grating structure remained). We studied the effect of the overlay target segmentation on the precision and robustness of wafer-level overlay performance. Different lithography processes were also studied, including single layer lithography and tri-layer lithography with planarized spacer grating structures. We found there are strong correlations between overlay measurement accuracy and background segmentation rules. The results of our study will be presented and discussed in this paper.

  3. Design and development of a mobile image overlay system for needle interventions.

    PubMed

    Anand, M; King, F; Ungi, T; Lasso, A; Rudan, J; Jayender, J; Fritz, J; Carrino, J A; Jolesz, F A; Fichtinger, G

    2014-01-01

    Previously, a static and adjustable image overlay systems were proposed for aiding needle interventions. The system was either fixed to a scanner or mounted over a large articulated counterbalanced arm. Certain drawbacks associated with these systems limited the clinical translation. In order to minimize these limitations, we present the mobile image overlay system with the objective of reduced system weight, smaller dimension, and increased tracking accuracy. The design study includes optimal workspace definition, selection of display device, mirror, and laser source. The laser plane alignment, phantom design, image overlay plane calibration, and system accuracy validation methods are discussed. The virtual image is generated by a tablet device and projected into the patient by using a beamsplitter mirror. The viewbox weight (1.0 kg) was reduced by 8.2 times and image overlay plane tracking precision (0.21 mm, STD = 0.05) was improved by 5 times compared to previous system. The automatic self-calibration of the image overlay plane was achieved in two simple steps and can be done away from patient table. The fiducial registration error of the physical phantom to scanned image volume registration was 1.35 mm (STD = 0.11). The reduced system weight and increased accuracy of optical tracking should enable the system to be hand held by the physician and explore the image volume over the patient for needle interventions. PMID:25571403

  4. Interaction of nanostructured metal overlayers with oxide surfaces

    NASA Astrophysics Data System (ADS)

    Fu, Qiang; Wagner, Thomas

    2007-11-01

    Interactions between metals and oxides are key factors to determine the performance of metal/oxide heterojunctions, particularly in nanotechnology, where the miniaturization of devices down to the nanoregime leads to an enormous increase in the density of interfaces. One central issue of concern in engineering metal/oxide interfaces is to understand and control the interactions which consist of two fundamental aspects: (i) interfacial charge redistribution — electronic interaction, and (ii) interfacial atom transport — chemical interaction. The present paper focuses on recent advances in both electronic and atomic level understanding of the metal-oxide interactions at temperatures below 1000 ∘C, with special emphasis on model systems like ultrathin metal overlayers or metal nanoclusters supported on well-defined oxide surfaces. The important factors determining the metal-oxide interactions are provided. Guidelines are given in order to predict the interactions in such systems, and methods to desirably tune them are suggested. The review starts with a brief summary of the physics and chemistry of heterophase interface contacts. Basic concepts for quantifying the electronic interaction at metal/oxide interfaces are compared to well-developed contact theories and calculation methods. The chemical interaction between metals and oxides, i.e., the interface chemical reaction, is described in terms of its thermodynamics and kinetics. We review the different chemical driving forces and the influence of kinetics on interface reactions, proposing a strong interplay between the chemical interaction and electronic interaction, which is decisive for the final interfacial reactivity. In addition, a brief review of solid-gas interface reactions (oxidation of metal surfaces and etching of semiconductor surfaces) is given, in addition to a comparison of a similar mechanism dominating in solid-solid and solid-gas interface reactions. The main body of the paper reviews

  5. High strength and corrosion resistant alloys weld overlays for oil patch applications

    SciTech Connect

    Hibner, E.L.; Maligas, M.N.; Vicic, J.C.

    1995-10-01

    Corrosion resistant alloys (CRAs) are specified for oilfield applications where severe environments cause general corrosion, pitting, crevice corrosion, chloride stress corrosion cracking and more importantly sulfide stress cracking. Historically, alloy 625 (UNS N06625) weld overlay has successfully been used in severely corrosive environments. Alloy 686 (UNS N06686) and alloy 725 (UNS N07725) have recently been evaluated as replacement materials for alloy 625. Alloy 686, because of it`s high alloying content, exhibits superior corrosion resistance to alloy 625. And, alloy 725 is a highly corrosion resistant alloy capable of being age hardened to 0.2% yield strengths of above 827 MPa (120 ksi) Mechanical properties and Slow Strain Rate test results for the alloy 686 and alloy 725 weld overlays are discussed relative to alloy 625, alloy C-22 (UNS N06622) and alloy 59 (UNS N06059) weld overlays.

  6. Threshold analysis of the susceptible-infected-susceptible model on overlay networks

    NASA Astrophysics Data System (ADS)

    Wu, Qingchu; Zhang, Haifeng; Small, Michael; Fu, Xinchu

    2014-07-01

    In this paper, we study epidemic spreading on overlay networks in which n multiple sets of links interconnect among the same nodes. By using the microscopic Markov-chain approximation (MMA) approach, we establish the conditions of epidemic outbreak for two kinds of spreading mechanisms in such an overlay network: the concatenation case and the switching case. When a uniform infection rate is set in all the subnetworks, we find the epidemic threshold for the switching case is just n times as large as that of concatenation case. We also find that the overlay network with a uniform infection rate can be considered as an equivalent (in the sense of epidemic dynamics and epidemic threshold) weighted network. To be specific, the concatenation case corresponds to the integer weighted network, while the switching case corresponds to the fractional weighted network. Interestingly, the time-varying unweighted network can be mapped into the static weighted network. Our analytic results exhibit good agreement with numerical simulations.

  7. Weld overlay coatings for erosion control. Task A: Literature review, progress report

    SciTech Connect

    Levin, B.; DuPont, J.N.; Marder, A.R.

    1993-03-03

    A literature review was made. In spite of similarities between abrasive wear and solid particle erosion, weld overlay hardfacing alloys that exhibit high abrasion resistance may not necessarily have good erosion resistance. The performance of weld overlay hardfacing alloys in erosive environments has not been studied in detail. It is believed that primary-solidified hard phases such as carbides and intermetallic compounds have a strong influence on erosion resistance of weld overlay hardfacing alloys. However, relationships between size, shape, and volume fraction of hard phases in a hardfacing alloys and erosion resistance were not established. Almost all hardfacing alloys can be separated into two major groups based upon chemical compositions of the primary solidified hard phases: (a) carbide hardening alloys (Co-base/carbide, WC-Co and some Fe base superalloys); and (b) intermetallic hardening alloys (Ni-base alloys, austenitic steels, iron-aluminides).

  8. Effects of indium and tin overlayers on the photoluminescence spectrum of mercuric iodide

    NASA Astrophysics Data System (ADS)

    James, R. B.; Bao, X. J.; Schlesinger, T. E.; Ortale, C.; Cheng, A. Y.

    1990-03-01

    Mercuric iodide (HgI2 ) crystals with semitransparent metal overlayers of indium and tin were characterized using low-temperature photoluminescence (PL) spectroscopy. The PL spectra were found to differ for points beneath the thin metal overlayers and points that were masked off during each deposition. The photoluminescence data were compared with PL measurements taken on HgI2 photodetectors with indium-tin-oxide (ITO) entrance electrodes. The similarities of the spectra for the HgI2 samples with In, Sn, and ITO conducting overlayers indicate that the regions in the ITO-contacted photodetectors with relatively poor photoresponses are associated with the interaction of indium or tin with the mercuric iodide substrate.

  9. Characterizing the Global Impact of P2P Overlays on the AS-Level Underlay

    NASA Astrophysics Data System (ADS)

    Rasti, Amir Hassan; Rejaie, Reza; Willinger, Walter

    This paper examines the problem of characterizing and assessing the global impact of the load imposed by a Peer-to-Peer (P2P) overlay on the AS-level underlay. In particular, we capture Gnutella snapshots for four consecutive years, obtain the corresponding AS-level topology snapshots of the Internet and infer the AS-paths associated with each overlay connection. Assuming a simple model of overlay traffic, we analyze the observed load imposed by these Gnutella snapshots on the AS-level underlay using metrics that characterize the load seen on individual AS-paths and by the transit ASes, illustrate the churn among the top transit ASes during this 4-year period, and describe the propagation of traffic within the AS-level hierarchy.

  10. 40-Gb/s FSK modulated WDM-PON with variable-rate multicast overlay.

    PubMed

    Xin, Xiangjun; Liu, Bo; Zhang, Lijia; Yu, Jianjun

    2011-06-20

    This paper proposes a novel conjugate-driven frequency shift keying (FSK) modulated wavelength division multiplexing passive network (WDM-PON) with variable-rate multicast services. Optical orthogonal frequency division multiplexing (OFDM) is adopted for multicast overlay services with different rate requirements. A differential detection is used for the demodulation of FSK signal, which can eliminate the crosstalk from the OFDM signal. A total 40-Gb/s FSK point to point (P2P) signal and 6.3-Gb/s OFDM overlay with three kinds of variable-rate multicast services are experimentally demonstrated. A physical-layer adaptive identification is proposed for the variable-rate multicast services. After 25 km single mode fiber (SMF) transmission, the power penalties of FSK P2P signal and OFDM multicast overlay are 1.3 dB and 1.7 dB respectively. PMID:21716492

  11. Full chip two-layer CD and overlay process window analysis

    NASA Astrophysics Data System (ADS)

    Gupta, Rachit; Shang, Shumay; Sturtevant, John

    2015-03-01

    In-line CD and overlay metrology specifications are typically established by starting with design rules and making certain assumptions about error distributions which might be encountered in manufacturing. Lot disposition criteria in photo metrology (rework or pass to etch) are set assuming worst case assumptions for CD and overlay respectively. For example poly to active overlay specs start with poly endcap design rules and make assumptions about active and poly lot average and across lot CDs, and incorporate general knowledge about poly line end rounding to ensure that leakage current is maintained within specification. There is an opportunity to go beyond generalized guard band design rules to full-chip, design-specific, model-based exploration of worst case layout locations. Such an approach can leverage not only the above mentioned coupling of CD and overlay errors, but can interrogate all layout configurations for both layers to help determine lot-specific, design-specific CD and overlay dispositioning criteria for the fab. Such an approach can elucidate whether for a specific design layout there exist asymmetries in the response to misalignment which might be exploited in manufacturing. This paper will investigate an example of two-layer model-based analysis of CD and overlay errors. It is shown, somewhat non-intuitively, that there can be small preferred misalignment asymmetries which should be respected to protect yield. We will show this relationship for via-metal overlap. We additionally present a new method of displaying edge placement process window variability, akin to traditional CD process window analysis.

  12. A safety evaluation for overlay disbonding of high-temperature and pressure vessels

    SciTech Connect

    Horita, Ryuichi; Nakajima; Hiroyuki; Tanaka, Kazunori; Murakami, Shunzo; Fujii, Tadaomi

    1995-11-01

    Hydrogen induced disbonding test (autoclave test) of stainless weld-overlaid 2-1/4Cr-1Mo and 2-1/4Cr-1Mo-1/4V steel, and the calculations of residual hydrogen contents at the fusion boundary in the specimens and actual vessels, were performed. The effects of microstructure of weld overlay near the fusion boundary and postweld heat treatment on disbonding resistance were clarified, and critical hydrogen content values in weld overlay to prevent disbonding were obtained. A simple evaluation method for disbonding in actual vessels using Tempering Parameter was established.

  13. Robotic weld overlay coatings for erosion control. Quarterly technical progress report, January 1993--March 1993

    SciTech Connect

    Levin, B.F.; Dupont, J.N.; Marder, A.R.

    1993-04-18

    Twelve weld overlay hardfacing alloys have been selected for preliminary erosion testing based on a literature review These alloys have been separated into three major groups: (1) Cobalt containing alloys, (2) Nickel-base alloys, (3) Iron base alloys. These alloys are being applied to carbon steel substrates and will undergo preliminary erosion testing to identify candidates weld overlay alloys for erosion control in CFB boilers. The candidate alloys selected from the preliminary erosion tests will then undergo more detailed evaluations in future research.

  14. A Spatial Overlay Ranking Method for a Geospatial Search of Text Objects

    USGS Publications Warehouse

    Lanfear, Kenneth J.

    2006-01-01

    Earth-science researchers need the capability to find relevant information by location and topic. Conventional geographic techniques that simply check whether polygons intersect can efficiently achieve a high recall on location, but can not achieve precision for ranking results in likely order of importance to the reader. A spatial overlay ranking based upon how well an object's footprint matches the search area provides a more effective way to spatially search a collection of reports, and avoids many of the problems associated with an 'in/out' (True/False) boolean search. Moreover, spatial overlay ranking appears to work well even when spatial extent is defined only by a simple bounding box.

  15. Scalable Tool Infrastructure for the Cray XT Using Tree-Based Overlay Networks

    SciTech Connect

    Roth, Philip C; Vetter, Jeffrey S

    2009-01-01

    Performance, debugging, and administration tools are critical for the effective use of parallel computing platforms, but traditional tools have failed to overcome several problems that limit their scalability, such as communication between a large number of tool processes and the management and processing of the volume of data generated on a large number of compute nodes. A tree-based overlay network has proven effective for overcoming these challenges. In this paper, we present our experiences in bringing our MRNet tree-based overlay network infrastructure to the Cray XT platform, including a description of proof-of-concept tools that use MRNet on the Cray XT.

  16. Corneal thickness in glaucoma.

    PubMed

    De Cevallos, E; Dohlman, C H; Reinhart, W J

    1976-02-01

    The central corneal stromal thickness of patients with open angle glaucoma, secondary glaucoma (the majority aphakic), or a history of unilateral acute angle closure glaucoma were measured and compared with the stromal thickness of a group of normal patients. In open angle glaucoma, there was a small but significant increase in the average stromal thickness. This thickness increase was, in all likelihood, due to an abnormal function of the endothelium in this disease since the level of the intraocular pressure did not seem to be a factor. There was no correlation between stromal thickness and duration of the glaucoma or type of anti-glaucomatous medication. Most cases of secondary glaucome, controlled medically or not, had markedly increased corneal thickness, again, most likely, due to endothelial damage rather than to level of intraocular pressure. After an angle closure attack, permanent damage to the cornea was found to be rare. PMID:1247273

  17. Evaluation of Iron Aluminide Weld Overlays for Erosion-Corrosion Resistant Boiler Tube Coatings in Low NOx Boilers

    SciTech Connect

    Regina, J.R.; Lim, M.; Barbosa, N., DuPont, J.N.; Marder, A.R.

    2000-04-28

    Iron aluminide weld overlays containing ternary additions and thermal spray coatings are being investigated for corrosion protection of boiler tubes in Low NO{sub x} burners. The primary objective of the research is to identify overlay and thermal spray compositions that provide corrosion protection of waterwall boiler tubes.

  18. Lead Thickness Measurements

    SciTech Connect

    Rucinski, R.; /Fermilab

    1998-02-16

    The preshower lead thickness applied to the outside of D-Zero's superconducting solenoid vacuum shell was measured at the time of application. This engineering documents those thickness measurements. The lead was ordered in sheets 0.09375-inch and 0.0625-inch thick. The tolerance on thickness was specified to be +/- 0.003-inch. The sheets all were within that thickness tolerance. The nomenclature for each sheet was designated 1T, 1B, 2T, 2B where the numeral designates it's location in the wrap and 'T' or 'B' is short for 'top' or 'bottom' half of the solenoid. Micrometer measurements were taken at six locations around the perimeter of each sheet. The width,length, and weight of each piece was then measured. Using an assumed pure lead density of 0.40974 lb/in{sup 3}, an average sheet thickness was calculated and compared to the perimeter thickness measurements. In every case, the calculated average thickness was a few mils thinner than the perimeter measurements. The ratio was constant, 0.98. This discrepancy is likely due to the assumed pure lead density. It is not felt that the perimeter is thicker than the center regions. The data suggests that the physical thickness of the sheets is uniform to +/- 0.0015-inch.

  19. Optimization of EUVL reticle thickness for image placement accuracy

    NASA Astrophysics Data System (ADS)

    Zheng, Liang; Mikkelson, Andrew R.; Abdo, Amr Y.; Engelstad, Roxann L.; Lovell, Edward G.; White, Thomas J.

    2003-12-01

    Extreme ultraviolet lithography (EUVL) is one of the leading candidates for next-generation lithography in the sub-65 nm regime. The International Technology Roadmap for Semiconductors proposes overlay error budgets of 18 nm and 13 nm for the 45 nm and 32 nm nodes, respectively. Full three-dimensional finite element (FE) models were developed to identify the optimal mask thickness to minimize image placement (IP) errors. Five thicknesses of the EUVL reticle have been investigated ranging from 2.3 mm to 9.0 mm. The mask fabrication process was simulated, as well as the e-beam mounting, pattern transfer, and exposure mounting, utilizing FE structural models. Out-of-plane distortions and in-plane distortions were tracked for each process step. Both electrostatic and 3-point mounts were considered for the e-beam tool and exposure tool. In this case, increasing the thickness of the reticle will reduce the magnitude of the distortions. The effect of varying the reticle thickness on chucking was also studied. FE models were utilized to predict how changing the reticle thickness would affect the overall clamping response. By decreasing the reticle thickness (and therefore the effective bending stiffness), the deformed reticle is easier to flatten during chucking. In addition, the thermomechanical response of the reticle during exposure was investigated for different reticle thicknesses. Since conduction to the chuck is the main heat dissipation mechanism, decreasing the reticle thickness results in more energy being conducted away from the reticle, which reduces the maximum temperature rise and the corresponding thermal distortion. The FE simulations illustrate the optimal thickness to keep IP errors within the allotted error budget as well as provide the necessary flatness during typical chucking procedures.

  20. Impact of the back side flatness of a mask on the panel overlay

    NASA Astrophysics Data System (ADS)

    Kemmochi, Daisuke; Yoshikawa, Yutaka; Iwanaga, Yoshinori; Hirano, Termusa; Kinoshita, Hiroshi

    2015-07-01

    Recently, the annual increase in the definition of high-function panels for mobile devices such as smartphones or tablets has led to TFT-LCD and TFT-OLED (Organic Light Emitting Diode) circuits becoming increasingly miniaturized and densified. TFT circuits are comprised of a superposition of layers such as gates, acts and contact holes, with a certain amount of allowance between each layer. However, that allowance has now disappeared due to the high density of the circuit. Therefore, a high-precision mask overlay is essential in order to realize circuits with even higher density. In the mask manufacturing process, the mask is placed on a writer tool, during which the back side surface of the mask makes contact with the stage. This contact alters the front side flatness of the mask. Moreover, once the circuit pattern has been drawn on the mask, it is removed from the writer tool, thus altering the front side flatness and coordinates of the mask. In this paper, we evaluated the overlay of a panel that underwent exposure using a number of masks with different back side flatness. As a result, we confirmed that deviations in the back side flatness of each mask manifest themselves in the panel overlay. Therefore, we need to improve the flatness of the back side of masks hereafter in order to further enhance the panel overlay.

  1. Use of fabrics and other measures for retarding reflective cracking of asphaltic concrete overlays

    NASA Astrophysics Data System (ADS)

    Jackson, R. D.

    1980-03-01

    Prevention or control of reflection cracks in asphaltic concrete overlays has been a problem from the inception of this type of construction. The many different treatments that have been tried in an effort to solve this problem are: (1) reinforcement within and below the overlay, (2) bond breakers, (3) stress relieving layers, (4) asphalt-mix additives, and (5) placement of fabrics between the existing pavement and the overlay. At the present time, no treatment has been tried that will completely prevent the formation of reflection cracks. Some treatments do delay the formation of cracks, while others do not appear to help at all. Indications are that fabrics do have some beneficial effects, such as a moisture barrier, even though the overlays develop reflection cracks. The fabrics that have been tried for the control of reflection cracks included: (1) Petromat, (2) Bidim, (3) Typar, (4) Cerex, (5) Mirafi, (6) Structofors, (7) Bituthene, (8) Protecto-Wrap, and (9) Fiberglass. Asphalt-rubber interlayers, as formulated by the Arizona Refining Company and the Sahuaro Petroleum Company, show promise in retarding reflection cracks.

  2. Assessing the Crossdisciplinarity of Technology-Enhanced Learning with Science Overlay Maps and Diversity Measures

    ERIC Educational Resources Information Center

    Kalz, Marco; Specht, Marcus

    2014-01-01

    This paper deals with the assessment of the crossdisciplinarity of technology-enhanced learning (TEL). Based on a general discussion of the concept interdisciplinarity and a summary of the discussion in the field, two empirical methods from scientometrics are introduced and applied. Science overlay maps and the Rao-Stirling diversity index are…

  3. Passivation of hematite nanorod photoanodes with a phosphorus overlayer for enhanced photoelectrochemical water oxidation

    NASA Astrophysics Data System (ADS)

    Xiong, Dehua; Li, Wei; Wang, Xiaoguang; Liu, Lifeng

    2016-09-01

    Hematite (i.e., α-Fe2O3) nanorod photoanodes passivated with a phosphorus overlayer have been fabricated by decomposing sodium hypophosphite (NaH2PO2) at a low temperature over the hematite nanorod surface. Extensive scanning electron microscopy, transmission electron microscopy, x-ray diffractometry and UV–vis spectroscopy characterizations confirm that conformal deposition of an amorphous phosphorus overlayer does not change the crystal structure, morphology, and optical absorption properties of hematite photoanodes. X-ray photoelectron spectroscopy reveals that phosphorus in the deposited overlayer exists in an oxidized state. Comprehensive steady-state polarization, transient photocurrent response, and impedance spectroscopy measurements as well as Mott–Schottky analysis manifest that the phosphorus overlayer is able to effectively passivate surface states and suppress electron–hole recombination, substantially enhancing the photocurrent for water oxidation. Combining the phosphorization treatment with two-step thermal activation, a photocurrent density of 1.1 mA cm‑2 is achieved at 1.23 V versus reversible hydrogen electrode under illumination of 100 mW cm‑2, ca 55 times higher than that of the non-activated pristine hematite photoanode measured under the same conditions. The simple and fast phosphorization strategy we present here can be readily applied to passivate surfaces of other semiconductor photoelectrodes to improve their photoelectrochemical performance.

  4. Robotic weld overlay coatings for erosion control. Quarterly progress report, October 1993--December 1993

    SciTech Connect

    Levin, B.F.; DuPont, J.N.; Marder, A.R.

    1994-01-20

    Research is being conducted to develop criteria for selecting weld overlay coatings for erosion mitigation in Circulated Fluidized Beds. Twelve weld overlay alloys were deposited on 1018 steel substrates using plasma arc welding. Ten samples from each coating were prepared for erosion testing. All selected coatings were erosion tested at 400C and their erosion resistance and microstructure evaluated. Steady state erosion rates were similar for several weld overlay coatings (Ultimet, Inconel-625, Iron-Aluminide, 316L SS, and High Chromium Cast Iron) and were considerably lower than the remaining coating evaluated. These coatings had different base (Co, Fe, Ni-base). No correlations were found between room temperature microhardness of the weld overlay coatings and their erosion resistance at elevated temperature, although this criteria is often thought to be an indicator of erosion resistance. It was suggested that the coatings that showed similar erosion rates may have similar mechanical properties such as fracture strength, toughness and work hardening rates at this temperature. During the past quarter, Iron-Aluminide, Inconel-625, and 316L SS coatings were selected for more detailed investigations based upon the preliminary erosion test results. Microhardness tests were performed on eroded samples to determine the size of the work hardened zone and change in coatings hardness due to erosion. The work hardened zone was to correlated with erosion resistance of the coatings. Additional Iron-Aluminide, Inconel-625, and 316L SS coatings were deposited on 1018 steel substrates.

  5. A new approach to plane-sweep overlay: topological structuring and line-segment classification

    USGS Publications Warehouse

    van Roessel, Jan W.

    1991-01-01

    An integrated approach to spatial overlay was developed with the objective of creating a single function that can perform most of the tasks now assigned to discrete functions in current systems. Two important components of this system are a unique method for topological structuring, and a method for attribute propagation and line-segment classification. -Author

  6. Arbitration Intervention Worker (AIW) Services: Case Management Overlay in a Juvenile Diversion Program

    ERIC Educational Resources Information Center

    Poythress, Norman G.; Dembo, Richard; DuDell, Gary; Wareham, Jennifer

    2006-01-01

    In this issue we describe a clinical trials study of the impact of adding specific case manager overlay services to "treatment as usual" services for youths in a Juvenile Arbitration Program. In this first article we describe the experimental intervention, the Arbitration Intervention Worker (AIW) service, which was provided to a randomly selected…

  7. Fluorogenic membrane overlays to enumerate total coliforms, Escherichia coli, and total Vibrionaceae in shellfish and seawater

    Technology Transfer Automated Retrieval System (TEKTRAN)

    Three assays were developed to enumerate total coliforms, Escherichia coli, and total Vibrionaceae in shellfish and other foods and in seawater and other environmental samples. Assays involve membrane overlays of overnight colonies on non-selective agar plates to detect ß-glucuronidase and lysyl am...

  8. Disbond detection with piezoelectric wafer active sensors in RC structures strengthened with FRP composite overlays

    NASA Astrophysics Data System (ADS)

    Giurgiutiu, Victor; Harries, Kent; Petrou, Michael; Bost, Joel; Quattlebaum, Josh B.

    2003-12-01

    The capability of embedded piezoelectric wafer active sensors (PWAS) to perform in-situ nondestructive evaluation (NDE) for structural health monitoring (SHM) of reinforced concrete (RC) structures strengthened with fiber reinforced polymer (FRP) composite overlays is explored. First, the disbond detection method were developed on coupon specimens consisting of concrete blocks covered with an FRP composite layer. It was found that the presence of a disbond crack drastically changes the electromechanical (E/M) impedance spectrum measured at the PWAS terminals. The spectral changes depend on the distance between the PWAS and the crack tip. Second, large scale experiments were conducted on a RC beam strengthened with carbon fiber reinforced polymer (CFRP) composite overlay. The beam was subject to an accelerated fatigue load regime in a three-point bending configuration up to a total of 807,415 cycles. During these fatigue tests, the CFRP overlay experienced disbonding beginning at about 500,000 cycles. The PWAS were able to detect the disbonding before it could be reliably seen by visual inspection. Good correlation between the PWAS readings and the position and extent of disbond damage was observed. These preliminary results demonstrate the potential of PWAS technology for SHM of RC structures strengthened with FRP composite overlays.

  9. A quantitative comet assay: imaging and analysis of virus plaques formed with a liquid overlay.

    PubMed

    Zhu, Ying; Yin, John

    2007-01-01

    Although the plaque assay defines a "gold-standard" for measuring virus infectivity, its reliance on plaque counting limits its sensitivity. When the assay is performed with a liquid overlay, instead of agar overlay, spontaneous flows can promote a uni-directional spread of infection, creating elongated regions of cytopathology that resemble comets. As a model system comet and plaque cultures of vesicular stomatitis virus (VSV) on baby hamster kidney (BHK-21) cells were compared. Host-cell monolayers were infected with VSV particles, incubated 15 h in the presence of liquid or agar overlays and stained. VSV formed significantly larger comets than plaques, consistent with a mechanism of flow-enhanced spread. When antiviral drug (5-fluorouracil) was incorporated into the liquid overlay, comet sizes were reduced in a dose-dependent manner. Images of infected monolayers, acquired using a simple digital scanner, enabled a quantification of the inhibitory effect of the drug on infectivity. The resulting measure of drug susceptibility was found to be 18-fold more sensitive than the IC(50) measure attained by the traditional plaque-reduction assay. This quantitative comet assay has the potential to similarly enhance the sensitivity of infection measures for other plaque-forming viruses. PMID:17092573

  10. Semantic Overlays in Educational Content Networks--The hylOs Approach

    ERIC Educational Resources Information Center

    Engelhardt, Michael; Hildebrand, Arne; Lange, Dagmar; Schmidt, Thomas C.

    2006-01-01

    Purpose: The paper aims to introduce an educational content management system, Hypermedia Learning Objects System (hylOs), which is fully compliant to the IEEE LOM eLearning object metadata standard. Enabled through an advanced authoring toolset, hylOs allows the definition of instructional overlays of a given eLearning object mesh.…