Science.gov

Sample records for kev ion beam

  1. Experimental results of a dual-beam ion source for 200 keV ion implanter

    SciTech Connect

    Chen, L. H. Cui, B. Q.; Ma, R. G.; Ma, Y. J.; Tang, B.; Huang, Q. H.; Jiang, W. S.; Zheng, Y. N.

    2014-02-15

    A dual beam ion source for 200 keV ion implanter aimed to produce 200 keV H{sub 2}{sup +} and He{sup +} beams simultaneously has been developed. Not suitable to use the analyzing magnet, the purity of beam extracted from the source becomes important to the performance of implanter. The performance of ion source was measured. The results of experiments show that the materials of inlet tube of ion source, the time of arc ionization in ion source, and the amount of gas flow have significant influence on the purity of beam. The measures by using copper as inlet tube material, long time of arc ionization, and increasing the inlet of gas flow could effectively reduce the impurity of beam. And the method using the gas mass flow controller to adjust the proportion of H{sub 2}{sup +} and He{sup +} is feasible.

  2. Ion-chain interaction in keV ion-beam-irradiated polystyrene

    SciTech Connect

    Calcagno, L.; Foti, G.; Licciardello, A.; Puglisi, O.

    1987-09-21

    Molecular weight distribution has been measured in monodisperse polystyrene film (MW = 9 000 amu) after ion bombardment, in the ion fluence range 10/sup 11/--10/sup 13/ ions/cm/sup 2/. The chosen beams are 100 keV He, 200 keV Ne, and 400 keV Ar. The experimental data have been interpreted in terms of a simple statistical model for cross-links. The chemical yield is found to be very high and equal to 0.30, about a factor of 10 higher than the values given in the literature for gamma irradiation (M. Dole, in The Radiation Chemistry of Macromolecules (Academic, New York, 1973), Vol. 2, Chap. 5, p. 57).

  3. Estimation of keV submicron ion beam width using a knife-edge method

    NASA Astrophysics Data System (ADS)

    Ishii, Yasuyuki; Isoya, Akira; Kojima, Takuji; Arakawa, Kazuo

    2003-11-01

    A beam width measurement system has been developed for keV submicron ion beams of 0.1 μm or less in width assuming a round shape beam. The system enables to measure beam current change as a function of knife-edge position by cutting a beam focusing point (beam spot) with the sharp edge within a spatial resolution of 0.02 μm. The width of 30 keV order submicron H + ion beam was estimated by fitting current change curves based on three different ion density models: uniform, flat-top and Gaussian. Among these models, the flat-top model provide the most reasonable beam width of 0.56 μm interpreting contribution of halo around the beam spot to beam width estimation. The beam width measurement system with the high spatial resolution and the data analysis based on the flat-top ion density model should contribute to accelerate developments of submicron ion beam production technologies.

  4. Neutral beam injector for 475 keV MARS sloshing ions

    SciTech Connect

    Goebel, D.M.; Hamilton, G.W.

    1984-03-01

    A neutral beam injector system which produces 5 MW of 475 keV D/sup 0/ neutrals continuously on target has been designed. The beamline is intended to produce the sloshing ion distribution required in the end plug region of the conceptual MARS tandem mirror commercial reactor. The injector design utilizes the LBL self-extraction negative ion source and Transverse Field Focusing (TFF) accelerator to generate a long, ribbon ion beam. A laser photodetachment neutralizer strips over 90% of the negative ions. Magnetic and neutron shield designs are included to exclude the fringe fields of the end plug and provide low activation by the neutron flux from the target plasma. The use of a TFF accelerator and photodetachment neutralizer produce a total system electrical efficiency of about 63% for this design.

  5. Neutral beam injector for 475 keV MARS sloshing ions

    SciTech Connect

    Goebel, D.M.; Hamilton, G.W.

    1983-12-13

    A neutral beam injector system which produces 5 MW of 475 keV D/sup 0/ neutrals continuously on target has been designed. The beamline is intended to produce the sloshing ion distribution required in the end plug region of the conceptual MARS tandem mirror commercial reactor. The injector design utilizes the LBL self-extraction negative ion source and Transverse Field Focusing (TFF) accelerator to generate a long, ribbon ion beam. A laser photodetachment neutralizer strips over 90% of the negative ions. Magnetic and neutron shield designs are included to exclude the fringe fields of the end plug and provide low activation by the neutron flux from the target plasma. The use of a TFF accelerator and photodetachment neutralizer produces a total system electrical efficiency of about 63% for this design.

  6. Surface modifications of hydrogen storage alloy by heavy ion beams with keV to MeV irradiation energies

    NASA Astrophysics Data System (ADS)

    Abe, Hiroshi; Tokuhira, Shinnosuke; Uchida, Hirohisa; Ohshima, Takeshi

    2015-12-01

    This study deals with the effect of surface modifications induced from keV to MeV heavy ion beams on the initial reaction rate of a hydrogen storage alloy (AB5) in electrochemical process. The rare earth based alloys like this sample alloy are widely used as a negative electrode of Ni-MH (Nickel-Metal Hydride) battery. We aimed to improve the initial reaction rate of hydrogen absorption by effective induction of defects such as vacancies, dislocations, micro-cracks or by addition of atoms into the surface region of the metal alloys. Since defective layer near the surface can easily be oxidized, the conductive oxide layer is formed on the sample surface by O+ beams irradiation, and the conductive oxide layer might cause the improvement of initial reaction rate of hydriding. This paper demonstrates an effective surface treatment of heavy ion irradiation, which induces catalytic activities of rare earth oxides in the alloy surface.

  7. Electron collisional detachment processes for a 250 keV D/sup -/ ion beam in a partially ionized hydrogen target

    SciTech Connect

    Savas, S.E.

    1980-09-01

    Neutral atom beams with energies above 200 keV may be required for various purposes in magnetic fusion devices following TFTR, JET and MFTF-B. These beams can be produced much more efficiently by electron detachment from negative ion beams than by electron capture by positive ions. We have investigated the efficiency with which such neutral atoms can be produced by electron detachment in partially ionized hydrogen plasma neutralizers.

  8. Performance characteristics of HBC stripper foils irradiated by 650 keV H- and high intensity DC ion beams

    NASA Astrophysics Data System (ADS)

    Sugai, I.; Takagi, A.; Takeda, Y.; Irie, Y.; Oyaizu, M.; Kawakami, H.

    2014-06-01

    Newly developed Hybrid type Boron mixed Carbon (HBC) stripper foils are extensively used not only for the RCS of J-PARC and PSR of LANL, but also for other low energy, high intensity proton accelerators in medical applications. We had before tested HBC stripper foils with 3.2 MeV Ne+ and DC heavy ion beams. In order to further understand characteristics of HBC stripper foils, we measured the following parameters using the KEK-650 keV H- and light ion Cockcroft Walton DC accelerator: foil lifetime, thickness reduction, uniformity before and after beam irradiation, and foil deformation. Energy deposition in the present experiment was adjusted to a similar level to that of the HBC foil used in the RCS of J-PARC’. In addition, to understand the reason why the HBC stripper foils have high durability against high intensity beam irradiation, we investigated various physical properties, and compared them between the HBC foils and other tested carbon stripper foils. The sizes of the carbon particles in the HBC foil were found to play a vital role in the lifetime.

  9. KeV Ion Beam Induced Surface Modification of SiC Hydrogen Sensor

    SciTech Connect

    Muntele, C.I.; Ila, D.; Williams, E.K.; Poker, D.B.; Hensley, D.K.

    1999-11-29

    Silicon carbide, a wide-bandgap semiconductor, is currently used to fabricate an efficient high temperature hydrogen sensor. When a palladium coating is applied on the exposed surface of silicon carbide, the chemical reaction between palladium and hydrogen produces a detectable change in the surface chemical potential. Rather than applying a palladium film, we have implanted palladium ions into the silicon face of 6H, n-type Sic samples. The implantation energies and fluences, as well as the results obtained by monitoring the current through the sample in the presence of hydrogen are included in this paper.

  10. In-situ XMCD evaluation of ferromagnetic state at FeRh thin film surface induced by 1 keV Ar ion beam irradiation and annealing

    NASA Astrophysics Data System (ADS)

    Matsui, T.; Aikoh, K.; Sakamaki, M.; Amemiya, K.; Iwase, A.

    2015-12-01

    Surface ferromagnetic state of FeRh thin films irradiated with 1 keV Ar ion-beam has been investigated by using soft X-ray Magnetic Circular Dichroism (XMCD). It was revealed that the Fe atoms of the samples were strongly spin-polarized after Ar ion-beam irradiation. Due to its small penetration depth, 1 keV Ar ion-beam irradiation can modify the magnetic state at subsurface of the samples. In accordance with the XMCD sum rule analysis, the main component of the irradiation induced ferromagnetism at the FeRh film surface was to be effective spin magnetic moment, and not to be orbital moment. We also confirmed that the surface ferromagnetic state could be produced by thermal annealing of the excessively ion irradiated paramagnetic subsurface of the FeRh thin films. This novel magnetic modification technique by using ion irradiation and subsequent annealing can be a potential tool to control the surface magnetic state of FeRh thin films.

  11. Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling.

    PubMed

    Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

    2013-05-01

    Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ~10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al2O3/Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV. PMID:23592622

  12. Compact, maintainable 80-KeV neutral beam module

    DOEpatents

    Fink, Joel H.; Molvik, Arthur W.

    1980-01-01

    A compact, maintainable 80-keV arc chamber, extractor module for a neutral beam system immersed in a vacuum of <10.sup.-2 Torr, incorporating a nested 60-keV gradient shield located midway between the high voltage ion source and surrounding grounded frame. The shield reduces breakdown or arcing path length without increasing the voltage gradient, tends to keep electric fields normal to conducting surfaces rather than skewed and reduces the peak electric field around irregularities on the 80-keV electrodes. The arc chamber or ion source is mounted separately from the extractor or ion accelerator to reduce misalignment of the accelerator and to permit separate maintenance to be performed on these systems. The separate mounting of the ion source provides for maintaining same without removing the ion accelerator.

  13. Atom penetration from a thin film into the substrate during sputtering by polyenergetic Ar{sup +} ion beam with mean energy of 9.4 keV

    SciTech Connect

    Kalin, B.A.; Gladkov, V.P.; Volkov, N.V.; Sabo, S.E.

    1995-12-31

    Penetration of alien atoms (Be, Ni) into Be, Al, Zr, Si and diamond was investigated under Ar{sup +} ion bombardment of samples having thermally evaporated films of 30--50 nm. Sputtering was carried out using a wide energy spectrum beam of Ar{sup +} ions of 9.4 keV to dose D = 1 {times} 10{sup 16}--10{sup 19} ion/cm{sup 2}. Implanted atom distribution in the targets was measured by Rutherford backscattering spectrometry (RBS) of H{sup +} and He{sup +} ions with energy of 1.6 MeV as well as secondary ion mass-spectrometry (SIMS). During the bombardment, the penetration depth of Ar atoms increases with dose linearly. This depth is more than 3--20 times deeper than the projected range of bombarding ions and recoil atoms. This is a deep action effect. The analysis shows that the experimental data for foreign atoms penetration depth are similar to the data calculated for atom migration through the interstitial site in a field of internal (lateral) compressive stresses created in the near-surface layer of the substrate as a result of implantation. Under these experimental conditions atom ratio r{sub i}/r{sub m} (r{sub i} -- radius of dopant, r{sub m} -- radius target of substrate) can play a principal determining role.

  14. Size saturation in low energy ion beam synthesized nanoparticles in silica glass: 50 keV Ag{sup -} ions implantation, a case study

    SciTech Connect

    Kuiri, P. K.

    2010-09-15

    Fluence-dependent formation of Ag nanoparticles (NPs) in silica glass by 50 keV Ag{sup -} ions implantation has been studied. Samples implanted with fluences of 2x10{sup 16} ions cm{sup -2} and above are found to show an absorption band at around 410 nm, corresponding to the surface plasmon resonance (SPR) of the Ag NPs in silica glass. An increase in SPR peak intensity with increase in fluence has been observed up to a fluence of 7x10{sup 16} ions cm{sup -2} (F7), after which the absorption intensity shows a saturation. Simulations of the optical absorption spectra also indicated an increase in the absorption intensity and hence the size of the NPs with increase in fluence up to F7, beyond which NP size is seen to saturate. The saturation of fluence and the SPR intensity (or NP size) have been explained as coming due to a break up of larger Ag NPs formed near the surface by displacement spikes induced by subsequently incident Ag ions against their regrowth from the movement of Ag atoms toward the surface and their sputtering loss. Further, we have compared our observations with the earlier data on saturation of fluence and size of NPs in cases of Au and Zn, and concluded that the saturation of both fluence and NP size are general phenomena for low energy high fluence metal ion implantation.

  15. Secondary ion emission from V and Al surfaces under keV light ion on bombardment

    NASA Astrophysics Data System (ADS)

    Blauner, Patricia G.; Weller, Martha R.; Kaurin, Michael G.; Weller, Robert A.

    1986-03-01

    Positive secondary ion mass spectra have been measured for oxidized polycrystalline V and Al targets bombarded by H +, H 2+, He + and Ar + ions with beam energies ranging from 25 keV to 275 keV. An enhancement in the relative yield of positive ions of electronegative surface constituents, in particular O + is observed under light ion bombardment. Metallic ion intensities were found to decrease with increasing primary beam energy in proportion to the estimated total sputtering yields for these targets and beams. In contrast, the O + secondary ion intensities were independent of primary beam energy. This behavior is similar to that observed previously with heavy ions of comparable velocities. In addition, for the projectiles and targets used in these measurements, no energy thresholds or collective effects were observed in the emission of any positive ion. Published data on secondary ion emission resulting from electron, photon, and heavy ion bombardment are compared with these results.

  16. Ion beam mixing by focused ion beam

    SciTech Connect

    Barna, Arpad; Kotis, Laszlo; Labar, Janos L.; Osvath, Zoltan; Toth, Attila L.; Menyhard, Miklos; Zalar, Anton; Panjan, Peter

    2007-09-01

    Si amorphous (41 nm)/Cr polycrystalline (46 nm) multilayer structure was irradiated by 30 keV Ga{sup +} ions with fluences in the range of 25-820 ions/nm{sup 2} using a focused ion beam. The effect of irradiation on the concentration distribution was studied by Auger electron spectroscopy depth profiling, cross-sectional transmission electron microscopy, and atomic force microscopy. The ion irradiation did not result in roughening on the free surface. On the other hand, the Ga{sup +} irradiation produced a strongly mixed region around the first Si/Cr interface. The thickness of mixed region depends on the Ga{sup +} fluence and it is joined to the pure Cr matrix with an unusual sharp interface. With increasing fluence the width of the mixed region increases but the interface between the mixed layer and pure Cr remains sharp. TRIDYN simulation failed to reproduce this behavior. Assuming that the Ga{sup +} irradiation induces asymmetric mixing, that is during the mixing process the Cr can enter the Si layer, but the Si cannot enter the Cr layer, the experimental findings can qualitatively be explained.

  17. Neon Ion Beam Lithography (NIBL).

    PubMed

    Winston, Donald; Manfrinato, Vitor R; Nicaise, Samuel M; Cheong, Lin Lee; Duan, Huigao; Ferranti, David; Marshman, Jeff; McVey, Shawn; Stern, Lewis; Notte, John; Berggren, Karl K

    2011-10-12

    Existing techniques for electron- and ion-beam lithography, routinely employed for nanoscale device fabrication and mask/mold prototyping, do not simultaneously achieve efficient (low fluence) exposure and high resolution. We report lithography using neon ions with fluence <1 ion/nm(2), ∼1000× more efficient than using 30 keV electrons, and resolution down to 7 nm half-pitch. This combination of resolution and exposure efficiency is expected to impact a wide array of fields that are dependent on beam-based lithography. PMID:21899279

  18. Topography evolution of 500 keV Ar(4+) ion beam irradiated InP(100) surfaces - formation of self-organized In-rich nano-dots and scaling laws.

    PubMed

    Sulania, Indra; Agarwal, Dinesh C; Kumar, Manish; Kumar, Sunil; Kumar, Pravin

    2016-07-27

    We report the formation of self-organized nano-dots on the surface of InP(100) upon irradiating it with a 500 keV Ar(4+) ion beam. The irradiation was carried out at an angle of 25° with respect to the normal at the surface with 5 different fluences ranging from 1.0 × 10(15) to 1.0 × 10(17) ions per cm(2). The morphology of the ion-irradiated surfaces was examined by atomic force microscopy (AFM) and the formation of the nano-dots on the irradiated surfaces was confirmed. The average size of the nano-dots varied from 44 ± 14 nm to 94 ± 26 nm with increasing ion fluence. As a function of the ion fluence, the variation in the average size of the nano-dots has a great correlation with the surface roughness, which changes drastically up to the ion fluence of 1.0 × 10(16) ions per cm(2) and attains almost a saturation level for further irradiation. The roughness and the growth exponent values deduced from the scaling laws suggest that the kinetic sputtering and the large surface diffusion steps of the atoms are the primary reasons for the formation of the self-organized nanodots on the surface. X-ray photo-electron spectroscopy (XPS) studies show that the surface stoichiometry changes with the ion fluence. With irradiation, the surface becomes more indium (In)-rich owing to the preferential sputtering of the phosphorus atoms (P) and the pure metallic In nano-dots evolve at the highest ion fluence. The cross-sectional scanning electron microscopy (SEM) analysis of the sample irradiated with the highest fluence showed the absence of the nanostructuring beneath the surface. The surface morphological changes at this medium energy ion irradiation are discussed in correlation with the low and high energy experiments to shed more light on the mechanism of the well separated nano-dot formation. PMID:27400760

  19. Modified betatron for ion beam fusion

    SciTech Connect

    Rostoker, N.; Fisher, A.

    1986-01-01

    An intense neutralized ion beam can be injected and trapped in magnetic mirror or tokamak geometry. The details of the process involve beam polarization so that the beam crosses the fringing fields without deflection and draining the polarization when the beam reaches the plasma. Equilibrium requires that a large betatron field be added in tokamak geometry. In mirror geometry a toroidal field must be added by means of a current along the mirror axis. In either case, the geometry becomes that of the modified betatron which has been studied experimentally and theoretically in recent years. We consider beams of d and t ions with a mean energy of 500 kev and a temperature of about 50 kev. The plasma may be a proton plasma with cold ions. It is only necessary for beam trapping or to carry currents. The ion energy for slowing down is initially 500 kev and thermonuclear reactions depend only on the beam temperature of 50 kev which changes very slowly. This new configuration for magnetic confinement fusion leads to an energy gain of 10--20 for d-t reactions whereas previous studies of beam target interaction predicted a maximum energy gain of 3--4. The high beam energy available with pulsed ion diode technology is also essential for advanced fuels. 16 refs., 3 figs.

  20. Is keV ion-induced pattern formation on Si(001) caused by metal impurities?

    PubMed

    Macko, Sven; Frost, Frank; Ziberi, Bashkim; Förster, Daniel F; Michely, Thomas

    2010-02-26

    We present ion beam erosion experiments performed in ultrahigh vacuum using a differentially pumped ion source and taking care that the ion beam hits the Si(001) sample only. Under these conditions no ion beam patterns form on Si for angles theta < or = 45 degrees with respect to the global surface normal using 2 keV Kr+ and fluences of approximately 2 x 10(22) ions m(-2). In fact, the ion beam induces a smoothening of preformed patterns. Simultaneous sputter deposition of stainless steel in this angular range creates a variety of patterns, similar to those previously ascribed to clean ion-beam-induced destabilization of the surface profile. Only for grazing incidence with 60 degrees < or = theta < or = 83 degrees do pronounced ion beam patterns form. It appears that the angular-dependent stability of Si(001) against pattern formation under clean ion beam erosion conditions is related to the angular dependence of the sputtering yield, and not primarily to a curvature-dependent yield as invoked frequently in continuum theory models. PMID:20097973

  1. Is keV ion-induced pattern formation on Si(001) caused by metal impurities?

    NASA Astrophysics Data System (ADS)

    Macko, Sven; Frost, Frank; Ziberi, Bashkim; Förster, Daniel F.; Michely, Thomas

    2010-02-01

    We present ion beam erosion experiments performed in ultrahigh vacuum using a differentially pumped ion source and taking care that the ion beam hits the Si(001) sample only. Under these conditions no ion beam patterns form on Si for angles thetav<=45° with respect to the global surface normal using 2 keV Kr+ and fluences of ≈ 2 × 1022 ions m-2. In fact, the ion beam induces a smoothening of preformed patterns. Simultaneous sputter deposition of stainless steel in this angular range creates a variety of patterns, similar to those previously ascribed to clean ion-beam-induced destabilization of the surface profile. Only for grazing incidence with 60°<=thetav<=83° do pronounced ion beam patterns form. It appears that the angular-dependent stability of Si(001) against pattern formation under clean ion beam erosion conditions is related to the angular dependence of the sputtering yield, and not primarily to a curvature-dependent yield as invoked frequently in continuum theory models.

  2. Neutral Beam Ion Confinement in NSTX

    SciTech Connect

    D.S. Darrow; E.D. Fredrickson; S.M. Kaye; S.S. Medley; and A.L. Roquemore

    2001-07-24

    Neutral-beam (NB) heating in the National Spherical Torus Experiment (NSTX) began in September 2000 using up to 5 MW of 80 keV deuterium (D) beams. An initial assessment of beam ion confinement has been made using neutron detectors, a neutral particle analyzer (NPA), and a Faraday cup beam ion loss probe. Preliminary neutron results indicate that confinement may be roughly classical in quiescent discharges, but the probe measurements do not match a classical loss model. MHD activity, especially reconnection events (REs) causes substantial disturbance of the beam ion population.

  3. Ion Beam Propulsion Study

    NASA Technical Reports Server (NTRS)

    2008-01-01

    The Ion Beam Propulsion Study was a joint high-level study between the Applied Physics Laboratory operated by NASA and ASRC Aerospace at Kennedy Space Center, Florida, and Berkeley Scientific, Berkeley, California. The results were promising and suggested that work should continue if future funding becomes available. The application of ion thrusters for spacecraft propulsion is limited to quite modest ion sources with similarly modest ion beam parameters because of the mass penalty associated with the ion source and its power supply system. Also, the ion source technology has not been able to provide very high-power ion beams. Small ion beam propulsion systems were used with considerable success. Ion propulsion systems brought into practice use an onboard ion source to form an energetic ion beam, typically Xe+ ions, as the propellant. Such systems were used for steering and correction of telecommunication satellites and as the main thruster for the Deep Space 1 demonstration mission. In recent years, "giant" ion sources were developed for the controlled-fusion research effort worldwide, with beam parameters many orders of magnitude greater than the tiny ones of conventional space thruster application. The advent of such huge ion beam sources and the need for advanced propulsion systems for exploration of the solar system suggest a fresh look at ion beam propulsion, now with the giant fusion sources in mind.

  4. Broad beam ion implanter

    DOEpatents

    Leung, Ka-Ngo

    1996-01-01

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes.

  5. Broad beam ion implanter

    DOEpatents

    Leung, K.N.

    1996-10-08

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes. 6 figs.

  6. Mutagenic effect of a keV range N + beam on mammalian cells

    NASA Astrophysics Data System (ADS)

    Feng, Huiyun; Wu, Lijun; Yu, Lixiang; Han, Wei; Liu, Xuelan; Yu, Zengliang

    2005-07-01

    The radiobiological effects of a keV (5-20 keV) range nitrogen ion (N +) beam on mammalian cells were studied, particularly with regard to the induction of mutation in the cell genome. The experiment demonstrated that the 20 keV N + beam, which resulted in cell death to a certain extent, induced a 2-3 fold increase in the mutation rates at the CD59 gene locus of the mammalian A L cells as compared to the control. Within certain fluence ranges (0-6 × 10 14 N +/cm 2), the cell survival displayed a down-up-down pattern which is similar to the phenomenon known as 'hyper-radiosensitivity' manifested under low-dose irradiation; the CD59 mutation rate firstly showed a gradual rise up to a 3-fold increment above the background level as the ion fluence went up to 4 × 10 14 N +/cm 2, after this peak point however, a downtrend appeared though the ion fluence increased further. It was also observed that the fraction of CD59 mutation bears no proportional relation to ion energy in further experiments of mutation induction by N + beams with the incident energies of 5, 10, 15 and 20 keV at the same fluence of 3 × 10 14 N +/cm 2. Analyses of the deletion patterns of chromosome 11 in CD59- mutants induced by 5-20 keV N + beams showed that these ions did not result in large-size chromosome deletions in this mammalian cell system. A preliminary discussion, suggesting that the mutagenic effect of such low-energy ion influx on mammalian cells could result from multiple processes involving direct collision of particles with cellular DNA, and cascade atomic and molecular reactions due to plentiful primary and secondary particles, was also presented. The study provided the first glimpse into the roles low-energy ions may play in inducing mutagenesis in mammalian cells, and results will be of much value in helping people to understand the contribution of low-energy ions to radiological effects of various ionising radiations.

  7. ALLIGATOR - An apparatus for ion beam assisted deposition with a broad-beam ion source

    NASA Astrophysics Data System (ADS)

    Wituschek, H.; Barth, M.; Ensinger, W.; Frech, G.; Rück, D. M.; Leible, K. D.; Wolf, G. K.

    1992-04-01

    Ion beam assisted deposition is a versatile technique for preparing thin films and coatings for various applications. Up to now a prototype setup for research purposes has been used in our laboratory. Processing of industrial standard workpieces requires a high current ion source with broad beam and high uniformity for homogeneous bombardment. In this contribution a new apparatus for large area samples will be described. It is named ALLIGATOR (German acronym of facility for ion assisted evaporation on transverse movable or rotary targets). In order to have a wide energy range available two ion sources are used. One delivers a beam energy up to 1.3 keV. The other is suitable for energies from 5 keV up to 40 keV. The ``high-energy'' ion source is a multicusp multiaperture source with 180-mA total current and a beam diameter of 280 mm at the target position.

  8. Gel behavior of keV ion irradiated polystyrene

    SciTech Connect

    Calcagno, L.; Foti, G.; Licciardello, A.; Puglisi, O.

    1988-10-17

    Among the chemical and physical modifications induced by ion bombardment of polymers, the solubility changes are very important because of technological application for lithography in microelectronic devices. Solubility changes due to the occurrence of crosslinkings have been followed on monodisperse and polydisperse polystyrene after ion irradiations (10/sup 11/--10/sup 14/ ions/cm/sup 2/, keV energy). By using the Inokuty gel theory (M. Inokuti J. Appl. Phys. 38, 2999 (1963)), the chemical yield (crosslinking/eV) has been determined for different molecular weights and molecular weight distributions.

  9. Funnel cone for focusing intense ion beams on a target

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Ni, P.

    2009-10-05

    We describe a funnel cone for concentrating an ion beam on a target. The cone utilizes the reflection characteristic of ion beams on solid walls to focus the incident beam andincrease beam intensity on target. The cone has been modeled with the TRIM code. A prototype has been tested and installed for use in the 350-keV K+ NDCX target chamber.

  10. Digging gold: keV He(+) ion interaction with Au.

    PubMed

    Veligura, Vasilisa; Hlawacek, Gregor; Berkelaar, Robin P; van Gastel, Raoul; Zandvliet, Harold J W; Poelsema, Bene

    2013-01-01

    Helium ion microscopy (HIM) was used to investigate the interaction of a focused He(+) ion beam with energies of several tens of kiloelectronvolts with metals. HIM is usually applied for the visualization of materials with extreme surface sensitivity and resolution. However, the use of high ion fluences can lead to significant sample modifications. We have characterized the changes caused by a focused He(+) ion beam at normal incidence to the Au{111} surface as a function of ion fluence and energy. Under the influence of the beam a periodic surface nanopattern develops. The periodicity of the pattern shows a power-law dependence on the ion fluence. Simultaneously, helium implantation occurs. Depending on the fluence and primary energy, porous nanostructures or large blisters form on the sample surface. The growth of the helium bubbles responsible for this effect is discussed. PMID:23946914

  11. Maskless, resistless ion beam lithography

    SciTech Connect

    Ji, Qing

    2003-03-10

    As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O{sub 2}{sup +}, BF{sub 2}{sup +}, P{sup +} etc., for surface modification and doping applications. With optimized source condition, around 85% of BF{sub 2}{sup +}, over 90% of O{sub 2}{sup +} and P{sup +} have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He{sup +} beam is as high as 440 A/cm{sup 2} {center_dot} Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O{sub 2}{sup +} ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O{sub 2}{sup +} ions with the dose of 10{sup 15} cm{sup -2}. The oxide can then serve as a hard mask for patterning of the Si film. The process flow and the experimental results for directly patterned poly-Si features

  12. Intense ion beam generator

    DOEpatents

    Humphries, Jr., Stanley; Sudan, Ravindra N.

    1977-08-30

    Methods and apparatus for producing intense megavolt ion beams are disclosed. In one embodiment, a reflex triode-type pulsed ion accelerator is described which produces ion pulses of more than 5 kiloamperes current with a peak energy of 3 MeV. In other embodiments, the device is constructed so as to focus the beam of ions for high concentration and ease of extraction, and magnetic insulation is provided to increase the efficiency of operation.

  13. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, G. (Inventor)

    1981-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids with multiple pairs of aligned holes positioned to direct a group of beamlets along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam. An accelerator electrode device downstream from the extraction grids is at a much lower potential than the grids to accelerate the combined beam. The application of the system to ion implantation is mentioned.

  14. Ion beam thruster shield

    NASA Technical Reports Server (NTRS)

    Power, J. L. (Inventor)

    1976-01-01

    An ion thruster beam shield is provided that comprises a cylindrical housing that extends downstream from the ion thruster and a plurality of annular vanes which are spaced along the length of the housing, and extend inwardly from the interior wall of the housing. The shield intercepts and stops all charge exchange and beam ions, neutral propellant, and sputter products formed due to the interaction of beam and shield emanating from the ion thruster outside of a fixed conical angle from the thruster axis. Further, the shield prevents the sputter products formed during the operation of the engine from escaping the interior volume of the shield.

  15. Ion beam surface modification

    NASA Technical Reports Server (NTRS)

    Dwight, D. W.

    1982-01-01

    The essential details of a study on the practical applications and mechanisms of polymer sputtering via Argon ion impact are summarized. The potential to modify the properties of polymer surfaces to improve their adherence, durability, biocompatibility, or other desirable properties by ion beam sputtering was emphasized. Ion beam milling can be of benefit as an analytical tool to obtain composition versus depth information. Ion impact from a directed ion gun source specifically etches polymer structures according to their morphologies, therefore this technique may be useful to study unknown or new morphological features. Factors addressed were related to: (1) the texture that arises on a polymer target after ion impact; (2) the chemistry of the top surface after ion impact; (3) the chemistry of sputtered films of polymeric material deposited on substrates placed adjacent to targets during ion impact; and (4) practical properties of textured polymer targets, specifically the wettability and adhesive bonding properties.

  16. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, Graeme (Inventor)

    1984-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids (16, 18) with multiple pairs of aligned holes positioned to direct a group of beamlets (20) along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam (14). An accelerator electrode device (22) downstream from the extraction grids, is at a much lower potential than the grids to accelerate the combined beam.

  17. Ion beam texturing

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    A microscopic surface texture is created by sputter etching a surface while simultaneously sputter depositing a lower sputter yield material onto the surface. A xenon ion beam source has been used to perform this texturing process on samples as large as three centimeters in diameter. Ion beam textured surface structures have been characterized with SEM photomicrographs for a large number of materials including Cu, Al, Si, Ti, Ni, Fe, Stainless steel, Au, and Ag. Surfaces have been textured using a variety of low sputter yield materials - Ta, Mo, Nb, and Ti. The initial stages of the texture creation have been documented, and the technique of ion beam sputter removal of any remaining deposited material has been studied. A number of other texturing parameters have been studied such as the variation of the texture with ion beam power, surface temperature, and the rate of texture growth with sputter etching time.

  18. Focused ion beam system

    DOEpatents

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  19. Focused ion beam system

    DOEpatents

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  20. Pulsed ion beam source

    DOEpatents

    Greenly, John B.

    1997-01-01

    An improved pulsed ion beam source having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center.

  1. Low energy ion beam dynamics of NANOGAN ECR ion source

    NASA Astrophysics Data System (ADS)

    Kumar, Sarvesh; Mandal, A.

    2016-04-01

    A new low energy ion beam facility (LEIBF) has been developed for providing the mass analyzed highly charged intense ion beams of energy ranging from a few tens of keV to a few MeV for atomic, molecular and materials sciences research. The new facility consists of an all permanent magnet 10 GHz electron cyclotron resonance (ECR) ion source (NANOGAN) installed on a high voltage platform (400 kV) which provides large currents of multiply charged ion beams. Higher emittance at low energy of intense ion beam puts a tremendous challenge to the beam optical design of this facility. The beam line consists of mainly the electrostatic quadrupoles, an accelerating section, analyzing cum switching magnet and suitable beam diagnostics including vacuum components. The accelerated ion beam is analyzed for a particular mass to charge (m/q) ratio as well as guided to three different lines along 75°, 90° and 105° using a large acceptance analyzing cum switching magnet. The details of transverse beam optics to all the beam lines with TRANSPORT and GICOSY beam optics codes are being described. Field computation code, OPERA 3D has been utilized to design the magnets and electrostatic quadrupoles. A theoretical estimation of emittance for optimized geometry of ion source is given so as to form the basis of beam optics calculations. The method of quadrupole scan of the beam is used to characterize the emittance of the final beam on the target. The measured beam emittance increases with m/q ratios of various ion beams similar to the trend observed theoretically.

  2. Intense Pulsed Heavy Ion Beam Technology

    NASA Astrophysics Data System (ADS)

    Masugata, Katsumi; Ito, Hiroaki

    Development of intense pulsed heavy ion beam accelerator technology is described for the application of materials processing. Gas puff plasma gun and vacuum arc discharge plasma gun were developed as an active ion source for magnetically insulated pulsed ion diode. Source plasma of nitrogen and aluminum were successfully produced with the gas puff plasma gun and the vacuum arc plasma gun, respectively. The ion diode was successfully operated with gas puff plasma gun at diode voltage 190 kV, diode current 2.2 kA and nitrogen ion beam of ion current density 27 A/cm2 was obtained. The ion composition was evaluated by a Thomson parabola spectrometer and the purity of the nitrogen ion beam was estimated to be 86%. The diode also operated with aluminum ion source of vacuum arc plasma gun. The ion diode was operated at 200 kV, 12 kA, and aluminum ion beam of current density 230 A/cm2 was obtained. The beam consists of aluminum ions (Al(1-3)+) of energy 60-400 keV, and protons (90-130 keV), and the purity was estimated to be 89 %. The development of the bipolar pulse accelerator (BPA) was reported. A double coaxial type bipolar pulse generator was developed as the power supply of the BPA. The generator was tested with dummy load of 7.5 ohm, bipolar pulses of -138 kV, 72 ns (1st pulse) and +130 kV, 70 ns (2nd pulse) were succesively generated. By applying the bipolar pulse to the drift tube of the BPA, nitrogen ion beam of 2 A/cm2 was observed in the cathode, which suggests the bipolar pulse acceleration.

  3. Ion-beam technologies

    SciTech Connect

    Fenske, G.R.

    1993-01-01

    This compilation of figures and diagrams reviews processes for depositing diamond/diamond-like carbon films. Processes addressed are chemical vapor deposition (HFCVD, PACVD, etc.), plasma vapor deposition (plasma sputtering, ion beam sputtering, evaporation, etc.), low-energy ion implantation, and hybrid processes (biased sputtering, IBAD, biased HFCVD, etc.). The tribological performance of coatings produced by different means is discussed.

  4. Beam imaging diagnostics for heavy ion beam fusion experiments

    SciTech Connect

    Bieniosek, F.M.; Prost, L.; Ghiorso, W.

    2003-05-01

    We are developing techniques for imaging beams in heavy-ion beam fusion experiments in the HIF-VNL in 2 to 4 transverse dimensions. The beams in current experiments range in energy from 50 keV to 2 MeV, with beam current densities from <10 to 200 mA/cm{sup 2}, and pulse lengths of 4 to 20 {micro}s. The beam energy will range up to 10 MeV in near-future beam experiments. The imaging techniques, based on kapton films and optical scintillators, complement and, in some cases, may replace mechanical slit scanners. The kapton film images represent a time-integrated image on the film exposed to the beam. The optical scintillator utilizes glass and ceramic scintillator material imaged by a fast, image-intensified CCD-based camera. We will discuss the techniques, results, and plans for implementation of the diagnostics on the beam experiments.

  5. Ion beam generating apparatus

    DOEpatents

    Brown, Ian G.; Galvin, James

    1987-01-01

    An ion generating apparatus utilizing a vacuum chamber, a cathode and an anode in the chamber. A source of electrical power produces an arc or discharge between the cathode and anode. The arc is sufficient to vaporize a portion of the cathode to form a plasma. The plasma is directed to an extractor which separates the electrons from the plasma, and accelerates the ions to produce an ion beam.

  6. An innovative experimental setup for the measurement of sputtering yield induced by keV energy ions

    NASA Astrophysics Data System (ADS)

    Salou, P.; Lebius, H.; Benyagoub, A.; Langlinay, T.; Lelièvre, D.; Ban-d'Etat, B.

    2013-09-01

    An innovative experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the ultra high vacuum (less than 10-9 mbar), avoiding thus any problem linked to possible contamination. This method allows to measure the angular distribution of sputtering yield. It is now possible to study the sputtering of many elements such as carbon based materials. Preliminary results are presented in the case of highly oriented pyrolytic graphite and tungsten irradiated by an Ar+ beam at 2.8 keV and 7 keV, respectively.

  7. The repetitive flaking of inconel 625 by 100 keV helium ion bombardment

    NASA Astrophysics Data System (ADS)

    Whitton, J. L.; Chen, Hao Ming; Littmark, U.; Emmoth, B.

    1981-05-01

    Repetitive flaking of Inconel 625 occurs with ion bombardment doses of than 10 18 100 keV helium ions cm -2, with up to 39 exfoliations being observed after bombardment with 3 × 10 19 ions cm -2. The thickness of the flakes, measured by scanning electron microscopy, is some 30% greater than when measured by Rutherford backscattering (RBS) of 1.8 MeV helium ions. These RBS measurements compare well with the thickness of the remaining layers in the resultant craters and to the most probable range of the 100 keV helium. The area of the flakes is dictated by the grain boundaries, and when one flake is ejected, the adjacent grains are prevented from doing so since there now exists an escape route for the injected helium. A strong dose rate dependence is observed; decreasing the beam current from 640 μA cm -2 to 64 μA cm -2 results in a factor 20 fewer flakes being exfoliated (for the same total dose of 3 × 10 19 ions cm -2). Successive flakes decrease in area, suggesting that eventually a cratered, but stable, surface will result with the only erosion being by the much less effective mechanism of sputtering.

  8. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    SciTech Connect

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  9. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    DOE PAGESBeta

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  10. Ion Beam Simulator

    Energy Science and Technology Software Center (ESTSC)

    2005-11-08

    IBSimu(Ion Beam Simulator) is a computer program for making two and three dimensional ion optical simulations. The program can solve electrostatic field in a rectangular mesh using Poisson equation using Finite Difference method (FDM). The mesh can consist of a coarse and a fine part so that the calculation accuracy can be increased in critical areas of the geometry, while most of the calculation is done quickly using the coarse mesh. IBSimu can launch ionmore » beam trajectories into the simulation from an injection surface or fomo plasma. Ion beam space charge of time independent simulations can be taken in account using Viasov iteration. Plasma is calculated by compensating space charge with electrons having Boltzmann energy distribution. The simulation software can also be used to calculate time dependent cases if the space charge is not calculated. Software includes diagnostic tools for plotting the geometry, electric field, space charge map, ion beam trajectories, emittance data and beam profiles.« less

  11. Ion Accelerator Merges Several Beams

    NASA Technical Reports Server (NTRS)

    Aston, G.

    1984-01-01

    Intense ion beam formed by merging multiple ion beamlets into one concentrated beam. Beamlet holes in graphite screen and focusing grids arranged in hexagonal pattern. Merged beam passes through single hole in each of aluminum accelerator and decelerator grids. Ion extraction efficiency, beam intensity, and focusing improved.

  12. Plasma ion sources and ion beam technology inmicrofabrications

    SciTech Connect

    Ji, Lili

    2007-01-01

    For over decades, focused ion beam (FIB) has been playing a very important role in microscale technology and research, among which, semiconductor microfabrication is one of its biggest application area. As the dimensions of IC devices are scaled down, it has shown the need for new ion beam tools and new approaches to the fabrication of small-scale devices. In the meanwhile, nanotechnology has also deeply involved in material science research and bioresearch in recent years. The conventional FIB systems which utilize liquid gallium ion sources to achieve nanometer scale resolution can no longer meet the various requirements raised from such a wide application area such as low contamination, high throughput and so on. The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. In this thesis, three novel ion beam tools have been developed and investigated as the alternatives for the conventional FIB systems in some particular applications. An integrated focused ion beam (FIB) and scanning electron microscope (SEM) system has been developed for direct doping or surface modification. This new instrument employs a mini-RF driven plasma source to generate focused ion beam with various ion species, a FEI two-lens electron (2LE) column for SEM imaging, and a five-axis manipulator system for sample positioning. An all-electrostatic two-lens column has been designed to focus the ion beam extracted from the source. Based on the Munro ion optics simulation, beam spot sizes as small as 100 nm can be achieved at beam energies between 5 to 35 keV if a 5 μm-diameter extraction aperture is used. Smaller beam spot sizes can be obtained with smaller apertures at sacrifice of some beam current. The FEI 2LE column, which utilizes Schottky emission, electrostatic focusing optics, and stacked-disk column construction, can provide high-resolution (as small as 20 nm) imaging capability, with fairly long working distance (25

  13. Ion beam lithography system

    DOEpatents

    Leung, Ka-Ngo

    2005-08-02

    A maskless plasma-formed ion beam lithography tool provides for patterning of sub-50 nm features on large area flat or curved substrate surfaces. The system is very compact and does not require an accelerator column and electrostatic beam scanning components. The patterns are formed by switching beamlets on or off from a two electrode blanking system with the substrate being scanned mechanically in one dimension. This arrangement can provide a maskless nano-beam lithography tool for economic and high throughput processing.

  14. Ion Beam Energy Dependant Study of Nanopore Sculpting

    NASA Astrophysics Data System (ADS)

    Ledden, Brad

    2005-03-01

    Experiments show that ion beams of various energies (1keV, 3keV, and 5keV) can be used to controllably ``sculpt'' nanoscale features in silicon nitride films using a feedback controlled ion beam sculpting apparatus. We report on nanopore ion beam sculpting effects that depend on inert gas ion beam energy. We show that: (1) all ion beam energies enable single nanometer control of structural dimensions in nanopores; (2) the ion beam energies above show similar ion beam flux dependence of nanopore formation; (3) the thickness of nanopores differs depending on ion beam energy. Computer simulations (with SRIM and TRIM) and an ``adatom'' surface diffusion model are employed to explain the dynamics of nanoscale dimension change by competing sputtering and surface mass transport processes induced by different ion beam irradiation. These experiments and theoretical work reveal the surface atomic transport phenomena in a quantitative way that allows the extraction of parameters such as the adatom surface diffusion coefficients and average travel distances.

  15. Medium-energy ion irradiation of Si and Ge wafers: studies of surface nanopatterning and signature of recrystallization in 100 keV Kr+ bombarded a-Si

    NASA Astrophysics Data System (ADS)

    Kumar, Pravin

    2016-03-01

    We report new and exciting experimental results on ion-induced nanopatterning of a-Si and a-Ge surfaces. The crystalline Si (100) and Ge (100) wafers were amorphized and an a/c interface was developed by pre-irradiation with a 50 keV Ar+ beam at normal incidence with an ion fluence of 5.0 × 1015 ions cm-2. These amorphized surfaces were post-irradiated with Ar+ and Kr+ beams at an angle of 60°. The post irradiation was done with ion fluences of 1.0 × 1017 ions cm-2. For each beam, two energies (50 and 200 keV for Ar+, 100 and 250 keV for Kr+) were chosen to ensure ion stopping in both sides of the a/c interface. Regular nanopatterning (in the form of ripples) is observed on the Ge surface only with the post irradiation of the Kr+ beam. The Si surface showed regular nanopatterning with the irradiation of both beams with two energies. For the ion beams crossing the a/c interface, ripples of higher amplitude and longer wavelength were formed. Further, the irradiation with a heavy beam yielded surface ripples of relatively larger amplitudes. The Raman measurements confirm amorphization of the pre-irradiated surfaces. Surprisingly, the post-irradiated Si surface with the 100 keV Kr+ beam showed evidence of recrystallization. In the paper we discuss the physics at the interface and explain the experimental findings.

  16. Nonpropulsive applications of ion beams

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    Eight centimeter ion beam sources utilizing xenon and argon have been developed that operate over a wide range of beam energies and currents. Three types of processes have been studied: sputter deposition, ion beam machining, and ion beam surface texturing. The broad range of source operating conditions allows optimum sputter deposition of various materials. An ion beam source was used to ion mill laser reflection holograms using photoresist patterns on silicon. Ion beam texturing was tried with many materials and has a multitude of potential applications.

  17. Infrared imaging diagnostics for INTF ion beam

    NASA Astrophysics Data System (ADS)

    Sudhir, D.; Bandyopadhyay, M.; Pandey, R.; Joshi, J.; Yadav, A.; Rotti, C.; Bhuyan, M.; Bansal, G.; Soni, J.; Tyagi, H.; Pandya, K.; Chakraborty, A.

    2015-04-01

    In India, testing facility named INTF [1] (Indian test facility) is being built in Institute for Plasma Research to characterize ITER-Diagnostic Neutral Beam (DNB). INTF is expected to deliver 60A negative hydrogen ion beam current of energy 100keV. The beam will be operated with 5Hz modulation having 3s ON/20s OFF duty cycle. To characterize the beam parameters several diagnostics are at different stages of design and development. One of them will be a beam dump, made of carbon fiber composite (CFC) plates placed perpendicular to the beam direction at a distance lm approximately. The beam dump needs to handle ˜ 6MW of beam power with peak power density ˜ 38.5MW/m2. The diagnostic is based on thermal (infra-red - IR) imaging of the footprint of the 1280 beamlets falling on the beam dump using four IR cameras from the rear side of the dump. The beam dump will be able to measure beam uniformity, beamlet divergence. It may give information on relative variation of negative ion stripping losses for different beam pulses. The design of this CFC based beam dump needs to address several physics and engineering issues, including some specific inputs from manufacturers. The manuscript will describe an overview of the diagnostic system and its design methodology highlighting those issues and the present status of its development.

  18. Pulsed ion beam source

    DOEpatents

    Greenly, J.B.

    1997-08-12

    An improved pulsed ion beam source is disclosed having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center. 12 figs.

  19. Negative ion based neutral beam injector for JT-60U

    NASA Astrophysics Data System (ADS)

    Okumura, Y.; Araki, M.; Hanada, M.; Inoue, T.; Kunieda, S.; Kuriyama, M.; Matsuoka, M.; Mizuno, M.; Ohara, Y.; Tanaka, M.; Watanabe, K.

    1992-10-01

    A 500 keV, 10 MW neutral beam injector is to be constructed in JT-60 Upgrade for the experiments of current drive and heating of heat density core plasmas. This is the first neutral beam injector in the world using negative ions as the primary ions. In the design, D- ion beams of 44 A, 500 keV are produced by two ion sources (22 A/each ion source) and neutralized in a long gas neutralizer. The total system efficiency is about 40%. The ion source is a cesium-seeded multicusp volume source having a three stage electrostatic accelerator. To reduce the stripping loss of D- ions in the accelerator, the ion source should be operated at a low pressure of 0.3 Pa with a current density of 13 mA/cm2. The first test of the full-size negative ion source is scheduled from middle of 1993.

  20. Dynamics of charge evolution in glass capillaries for 230-keV Xe23+ ions

    NASA Astrophysics Data System (ADS)

    Cassimi, A.; Ikeda, T.; Maunoury, L.; Zhou, C. L.; Guillous, S.; Mery, A.; Lebius, H.; Benyagoub, A.; Grygiel, C.; Khemliche, H.; Roncin, P.; Merabet, H.; Tanis, J. A.

    2012-12-01

    We have measured the transmission of 230-keV (10-keV/q) Xe23+ ions through insulating tapered glass capillaries of microscopic dimensions. The dynamics of charging and discharging processes have been investigated, evidencing an unexpected slow alignment of the beam along the capillary axis. Oscillations of the exiting beam position have been observed during the charging process associated to the formation of charge patches on the capillary inner walls. The emerging ions are guided with a characteristic guiding angle falling on a universal curve proposed for PET polymer nanocapillaries. This result, very similar to the channeling process, is somewhat surprising in view of the significant differences between the straight nanocapillary polymer foils and the tapered microscopic single glass capillary used here. The transmitted ions show no evidence of energy loss or charge changing except for the production of a small neutral fraction that was determined to be due to ions that had become neutralized to form atoms rather than due to photon emission. These results thus test and confirm the validity of transmission and guiding and provide insight into the dynamics of higher-energy ions than have been previously studied in this regard, allowing a determination of the maximum energy for which the guiding process might occur.

  1. High-energy recoil-ion emission in keV heavy-ion surface collisions

    NASA Astrophysics Data System (ADS)

    van Someren, B.; Rudolph, H.; Urazgil'din, I. F.; van Emmichoven, P. A. Zeijlmans; Niehaus, A.

    1997-11-01

    For keV Xe +, Kr + and Ar + ions incident at 30° on Cu(110) we have observed the emission of negatively charged particles with energies up to about 40% of the primary energy. By time-of-flight techniques we have found that electrons are emitted with energies up to 80 eV, whereas the negatively charged high-energy particles are Cu - recoil ions. High-energy Cu + ions have also been found. Simple energy and momentum conservation arguments show that such high recoil energies are indeed possible for multiple collision events in which the primary recoil ion scatters off one or more Cu atoms.

  2. Development of broad beam ion sources at CSSAR

    NASA Astrophysics Data System (ADS)

    Feng, Y. C.; You, D. W.; Kuang, Y. Z.

    1994-04-01

    High-energy and intense beam current broad beam ion sources have been developed for ion implantation and dynamic recoil mixing at CSSAR. The sources can be operated over beam energy and current ranges of 3-120 keV and 5-70 mA, respectively. For sputter coating of thin films, a series of focusing beam ion sources with different structures has also been developed. The energy and current range from 1-10 keV and 100-350 mA for different applications. For some applications, low-energy (below 100 eV) ion beams are required. CSSAR has developed a 6-cm-diam broad beam ion source. The source can be operated at beam energy 10-70 eV, and the beam current 15-80 mA has been extracted. Typical structures and operational data are given for the sources mentioned above. Recently a new type of broad beam metal ion source (Electron Beam Evaporation Metal Ion Source EBE) is being studied. Ion beams of several kinds of materials such as C, W, Ta, Mo, Cr, Ti, B, Cu, etc. have been extracted from the source. Typical operation conditions and ion yields are given in this paper.

  3. Metal Ion Sources for Ion Beam Implantation

    SciTech Connect

    Zhao, W. J.; Zhao, Z. Q.; Ren, X. T.

    2008-11-03

    In this paper a theme touched upon the progress of metal ion sources devoted to metal ion beam implantation (MIBI) will be reviewed. A special emphasis will be given to some kinds of ion sources such as ECR, MEVVA and Cluster ion sources. A novel dual hollow cathode metal ion source named DUHOCAMIS will be introduced and discussed.

  4. Ion beam sputter etching

    NASA Technical Reports Server (NTRS)

    Banks, Bruce A.; Rutledge, Sharon K.

    1986-01-01

    An ion beam etching process which forms extremely high aspect ratio surface microstructures using thin sputter masks is utilized in the fabrication of integrated circuits. A carbon rich sputter mask together with unmasked portions of a substrate is bombarded with inert gas ions while simultaneous carbon deposition occurs. The arrival of the carbon deposit is adjusted to enable the sputter mask to have a near zero or even slightly positive increase in thickness with time while the unmasked portions have a high net sputter etch rate.

  5. Introduction to Ion Beam Therapy

    SciTech Connect

    Martisikova, Maria

    2010-01-05

    Presently, ion beam therapy reaches an increasing interest within the field of radiation therapy, which is caused by the promising clinical results obtained in the last decades. Ion beams enable higher dose conformation to the tumor and increased sparing of the surrounding tissue in comparison to the standard therapy using high energy photons. Heavy ions, like carbon, offer in addition increased biological effectiveness, which makes them suitable for treatment of radioresistant tumors. This contribution gives an overview over the physical and biological properties of ion beams. Common fundamental principles of ion beam therapy are summarized and differences between standard therapy with high energy photons, proton and carbon ion therapy are discussed. The technologies used for the beam production and delivery are introduced, with emphasis to the differences between passive and active beam delivery systems. The last part concentrates on the quality assurance in ion therapy. Specialties of dosimetry in medical ion beams are discussed.

  6. Gabor lens focusing of a negative ion beam

    SciTech Connect

    Palkovic, J.A.; Mills, F.E.; Schmidt, C.; Young, D.E.

    1989-05-01

    Gabor or plasma lenses have previously been used to focus intense beams of positive ions at energies from 10 keV to 5 MeV. It is the large electrostatic field of the non-neutral plasma in the Gabor lens which is responsible for the focusing. Focusing an ion beam with a given sign of charge in a Gabor lens requires a non-neutral plasma with the opposite sign of charge as the beam. A Gabor lens constructed at Fermilab has been used to focus a 30 keV proton beam with good optical quality. We discuss studies of the action of a Gabor lens on a beam of negative ions. A Gabor lens has been considered for matching an H/sup /minus// beam into an RFQ in the redesign of the low energy section of the Fermilab linac. 9 refs., 3 figs., 1 tab.

  7. Heavy ion beam probing

    SciTech Connect

    Hickok, R L

    1980-07-01

    This report consists of the notes distributed to the participants at the IEEE Mini-Course on Modern Plasma Diagnostics that was held in Madison, Wisconsin in May 1980. It presents an overview of Heavy Ion Beam Probing that briefly describes the principles and discuss the types of measurements that can be made. The problems associated with implementing beam probes are noted, possible variations are described, estimated costs of present day systems, and the scaling requirements for large plasma devices are presented. The final chapter illustrates typical results that have been obtained on a variety of plasma devices. No detailed calculations are included in the report, but a list of references that will provide more detailed information is included.

  8. Performance of positive ion based high power ion source of EAST neutral beam injector.

    PubMed

    Hu, Chundong; Xie, Yahong; Xie, Yuanlai; Liu, Sheng; Xu, Yongjian; Liang, Lizhen; Jiang, Caichao; Li, Jun; Liu, Zhimin

    2016-02-01

    The positive ion based source with a hot cathode based arc chamber and a tetrode accelerator was employed for a neutral beam injector on the experimental advanced superconducting tokamak (EAST). Four ion sources were developed and each ion source has produced 4 MW @ 80 keV hydrogen beam on the test bed. 100 s long pulse operation with modulated beam has also been tested on the test bed. The accelerator was upgraded from circular shaped to diamond shaped in the latest two ion sources. In the latest campaign of EAST experiment, four ion sources injected more than 4 MW deuterium beam with beam energy of 60 keV into EAST. PMID:26932029

  9. Spatial distribution of upstream magnetospheric geq50 keV ions

    NASA Astrophysics Data System (ADS)

    Anagnostopoulos, G. C.; Argyropoulos, G.; Kaliabetsos, G.

    2000-01-01

    We present for the first time a statistical study of geq50 keV ion events of a magnetospheric origin upstream from Earth's bow shock. The statistical analysis of the 50-220 keV ion events observed by the IMP-8 spacecraft shows: (1) a dawn-dusk asymmetry in ion distributions, with most events and lower intensities upstream from the quasi-parallel pre-dawn side (4 LT-6 LT) of the bow shock, (2) highest ion fluxes upstream from the nose/dusk side of the bow shock under an almost radial interplanetary magnetic field (IMF) configuration, and (3) a positive correlation of the ion intensities with the solar wind speed and the index of geomagnetic index Kp, with an average solar wind speed as high as 620 km s-1 and values of the index Kp > 2. The statistical results are consistent with (1) preferential leakage of sim50 keV magnetospheric ions from the dusk magnetopause, (2) nearly scatter free motion of sim50 keV ions within the magnetosheath, and (3) final escape of magnetospheric ions from the quasi-parallel dawn side of the bow shock. An additional statistical analysis of higher energy (290-500 keV) upstream ion events also shows a dawn-dusk asymmetry in the occurrence frequency of these events, with the occurrence frequency ranging between sim16%-sim34% in the upstream region.

  10. An ion beam deceleration lens for ultra-low-energy ion bombardment of naked DNA

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Prakrajang, K.; Thongkumkoon, P.; Suwannakachorn, D.; Yu, L. D.

    2013-07-01

    Study of low-energy ion bombardment effect on biological living materials is of significance. High-energy ion beam irradiation of biological materials such as organs and cells has no doubt biological effects. However, ion energy deposition in the ion-bombarded materials dominantly occurs in the low-energy range. To investigate effects from very-low-energy ion bombardment on biological materials, an ion beam deceleration lens is necessary for uniform ion energy lower than keV. A deceleration lens was designed and constructed based on study of the beam optics using the SIMION program. The lens consisted of six electrodes, able to focus and decelerate primary ion beam, with the last one being a long tube to obtain a parallel uniform exiting beam. The deceleration lens was installed to our 30-kV bioengineering-specialized ion beam line. The final decelerated-ion energy was measured using a simple electrostatic field to bend the beam to range from 10 eV to 1 keV controlled by the lens parameters and the primary beam condition. In a preliminary test, nitrogen ion beam at 60 eV decelerated from a primary 20-keV beam bombarded naked plasmid DNA. The original DNA supercoiled form was found to change to relaxed and linear forms, indicating single or double strand breaks. The study demonstrated that the ion bombardment with energy as low as several-tens eV was possible to break DNA strands and thus potential to cause genetic modification of biological cells.

  11. Ion Beam Modification of Materials

    SciTech Connect

    Averback, B; de la Rubia, T D; Felter, T E; Hamza, A V; Rehn, L E

    2005-10-10

    This volume contains the proceedings of the 14th International Conference on Ion Beam Modification of Materials, IBMM 2004, and is published by Elsevier-Science Publishers as a special issue of Nuclear Instruments and Methods B. The conference series is the major international forum to present and discuss recent research results and future directions in the field of ion beam modification, synthesis and characterization of materials. The first conference in the series was held in Budapest, Hungary, 1978, and subsequent conferences were held every two years at locations around the Globe, most recently in Japan, Brazil, and the Netherlands. The series brings together physicists, materials scientists, and ion beam specialists from all over the world. The official conference language is English. IBMM 2004 was held on September 5-10, 2004. The focus was on materials science involving both basic ion-solid interaction processes and property changes occurring either during or subsequent to ion bombardment and ion beam processing in relation to materials and device applications. Areas of research included Nanostructures, Multiscale Modeling, Patterning of Surfaces, Focused Ion Beams, Defects in Semiconductors, Insulators and Metals, Cluster Beams, Radiation Effects in Materials, Photonic Devices, Ion Implantation, Ion Beams in Biology and Medicine including New Materials, Imaging, and Treatment.

  12. Electron beam ion sources and traps (invited)

    NASA Astrophysics Data System (ADS)

    Becker, Reinard

    2000-02-01

    The electron beam method of stepwise ionization to highest charge states has found applications in electron beam ion sources (EBISs) for accelerators and atomic physics collision experiments as well as in electron beam ion traps (EBITs) for x-ray and mass spectroscopy. A dense and almost monoenergetic electron beam provides a unique tool for ionization, because radiative recombination by slow electrons is negligible and charge exchange is almost avoided in ultrahigh vacua. These are essential differences to electron cyclotron resonance ion sources with inevitable low energy electrons and comparatively high gas pressure. The distinction between EBIS and EBIT as genuine devices has become meaningless, because EBISs may work as traps and almost all EBITs are feeding beamlines for external experiments. More interesting is to note the diversification of these devices, which demonstrates that a matured technology is finding dedicated answers for different applications. At present we may distinguish six major lines of development and application: high current EBISs for upcoming hadron colliders, super EBITs in the energy range above 300 keV for quantum electrondynamics tests, inexpensive and small EBISTs for atomic physics studies, a highly efficient EBIS with oscillating electrons, MEDEBIS for tumor therapy with C6+, and charge breeding in facilities for exotic radioactive beams.

  13. Energy Amplification and Beam Bunching in a Pulse Line Ion Accelerator

    SciTech Connect

    Roy, P K; Waldron, W L; Yu, S S; Coleman, J E; Henestroza, E; Grote, D P; Baca, D; Bieniosek, F M; Briggs, R J; Davidson, R C; Eylon, S; Friedman, A; Greenway, W G; Leitner, M; Logan, G B; Reginato, L L; Seidl, P A

    2006-06-08

    In a first beam dynamics validation experiment for a new Pulse Line Ion Acceleration (PLIA) concept, the predicted energy amplification and beam bunching were experimentally observed. Beam energy modulation of -80 keV to +150 keV was measured using a PLIA input voltage waveform of -21 kV to +12 kV. Ion pulses accelerated by 150 keV, and bunching by a factor of four were simultaneously achieved. The measured longitudinal phase space and current waveform of the accelerated beam are in good agreement with 3-D particle-in-cell simulations.

  14. Effect of 800 keV argon ions pre-damage on the helium blister formation of tungsten exposed to 60 keV helium ions

    NASA Astrophysics Data System (ADS)

    Chen, Zhe; Han, Wenjia; Yu, Jiangang; Zhu, Kaigui

    2016-04-01

    This study aims to investigate the effect of Ar8+ ions pre-damage on the following He2+ irradiation behavior of polycrystalline tungsten. We compared the irradiation resistance performance against 60 keV He2+ ions of undamaged tungsten samples with that of pre-damaged samples which were preliminarily exposed to 800 keV Ar8+ ions at a fluence of 4 × 1019 ions m-2. The experimental results indicate that the helium blistering of tungsten could be effectively relieved by the Ar8+ ions pre-damage, while the retention of helium around low energy desorption sites in the pre-damaged tungsten was larger than that of the undamaged samples. A strong orientation dependence of blistering had been observed, with the blister occurred preferentially on the surface of grains with normal direction close to <111>. The Ar8+ ions irradiation-induced damage altered the morphology of helium bubbles in tungsten exposed to the following He2+ irradiation significantly. The intensity of helium release peaks at relatively low temperatures (<600 K) was enhanced due to Ar8+ ions pre-damage.

  15. Electron beam ion source and electron beam ion trap (invited)

    SciTech Connect

    Becker, Reinard; Kester, Oliver

    2010-02-15

    The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not ''sorcery'' but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.

  16. Ion beam sputtering of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Sovey, J. S.

    1978-01-01

    Etching and deposition of fluoropolymers are of considerable industrial interest for applications dealing with adhesion, chemical inertness, hydrophobicity, and dielectric properties. This paper describes ion beam sputter processing rates as well as pertinent characteristics of etched targets and films. An argon ion beam source was used to sputter etch and deposit the fluoropolymers PTFE, FEP, and CTFE. Ion beam energy, current density, and target temperature were varied to examine effects on etch and deposition rates. The ion etched fluoropolymers yield cone or spire-like surface structures which vary depending upon the type of polymer, ion beam power density, etch time, and target temperature. Also presented are sputter target and film characteristics which were documented by spectral transmittance measurements, X-ray diffraction, ESCA, and SEM photomicrographs.

  17. Ion-induced photon emission of magnesium aluminate spinel during 60 keV Cu - implantation

    NASA Astrophysics Data System (ADS)

    Bandourko, V.; Lay, T. T.; Takeda, Y.; Lee, C. G.; Kishimoto, N.

    2001-04-01

    The beam-solid interaction during high flux heavy-ion implantation has been studied by the in situ detection of photon emission. A spinel of MgO· n(Al 2O 3) with n=2.4 was irradiated with 60 keV Cu - at dose rates of 10, 50 or 100 μA/cm 2 to a dose of 1.5×10 17 ions/cm2. Under the implantation, photon emission ranging from 1.4 to 6.2 eV was detected by a time-resolved optical device based on a fast-response CCD (Princeton Instruments: IMAX-512). Emission lines of sputtered Mg, Al and Cu atoms were observed. A comparison of the dose and dose rate dependence of the Cu I line intensity from MgO· n(Al 2O 3) with those obtained for amorphous (a-)SiO 2 substrate revealed the good correlation of Cu I line intensity with nanoparticle formation detected by optical absorbance measurement.

  18. ION BEAM COLLIMATOR

    DOEpatents

    Langsdorf, A.S. Jr.

    1957-11-26

    A device is described for defining a beam of high energy particles wherein the means for defining the beam in the horizontal and vertical dimension are separately adjustable and the defining members are internally cooled. In general, the device comprises a mounting block having a central opening through which the beam is projected, means for rotatably supporting two pairs of beam- forming members, passages in each member for the flow of coolant; the beam- forming members being insulated from each other and the block, and each having an end projecting into the opening. The beam-forming members are adjustable and may be cooperatively positioned to define the beam passing between the end of the members. To assist in projecting and defining the beam, the member ends have individual means connected thereto for indicating the amount of charge collected thereon due to beam interception.

  19. Structural and magnetic properties of zinc ferrite thin films irradiated by 90 keV neon ions

    NASA Astrophysics Data System (ADS)

    Gafton, E. V.; Bulai, G.; Caltun, O. F.; Cervera, S.; Macé, S.; Trassinelli, M.; Steydli, S.; Vernhet, D.

    2016-08-01

    The effects of 90 keV neon beam irradiation on the structure and magnetic properties of zinc ferrite thin films have been investigated through several methods, namely, X-ray diffraction technique, Vibrating Sample and SQUID magnetometers. Beforehand, the pristine have also been characterized using profilometry and microscopy techniques. In particular single-phase formation of the thin films deposited on monocrystalline Si (111) substrate by pulsed laser deposition technique was confirmed. Crystal lattice, coercivity, saturation magnetization have been studied for the first time, as a function of ion penetration depth and irradiation fluence. The chemical composition and the crystallinity of the films are not affected with the ion impact acting as a mechanical stress relief. On the contrary, both magnetization and coercivity are sensitive to Neq+ ion irradiation and exhibit different behaviours depending on the ion fluence range.

  20. Efficient, radiation-hardened, 400- and 800-keV neutral-beam injection systems

    SciTech Connect

    Anderson, O.A.; Cooper, W.S.; Fink, J.A.; Goldberg, D.A.; Ruby, L.; Soroka, L.; Tanabe, J.

    1983-04-01

    We present designs for two negative-ion based neutral beam lines with reactor-level power output. Both beam lines make use of such technologically advanced features as high-current-density surface-conversion ion sources, transverse-field-focussing (TFF) acceleration and transport, and laser photodetachment. For the second of these designs, we also presented detailed beam and vacuum calculations, as well as a brief description of a proof-of-principle test system currently under development.

  1. Ion beam modification of metals

    NASA Astrophysics Data System (ADS)

    Dearnaley, G.

    1990-04-01

    Energetic ions beams may be used in various ways to modify and so improve the tribological properties of metals. These methods include: — ion implantation of selected additive species; — ion beam mixing of thin deposited coatings; — ion-beam-assisted deposition of thicker overlay coatings. The first of these techniques has been widely used to modify the electronic properties of semiconductors, but has since been extended for the treatment of all classes of material. Tool steels can be strengthened by the ion implantation of nitrogen or titanium, to produce fine dispersions of hard second-phase precipitates. Solid solution strengthening, by combinations of substitutional and interstitial species, such as yttrium and nitrogen, has also been successful. Both ion beam mixing (IBM) and ion-beam-assisted deposition (IBAD) use a combination of coating and ion bombardment. In the first case, the objective is to intermix the coating and substrate by the aid of radiation-enhanced diffusion. In the latter case, the coating is densified and modified during deposition and the process can be continued in order to build up overlay coatings several μm in thickness. The surface can then be tailored, for instance to provide a hard and adherent ceramic such as silicon nitride, boron nitride or titanium nitride. It is an advantage that all the above processes can be applied at relatively low temperatures, below about 200° C, thereby avoiding distortion of precision components. Ion implantation is also being successfully applied for the reduction of corrosion, especially at high temperatures or in the atmosphere and to explore the mechanisms of oxidation. Ion-assisted coatings, being compact and adherent, provide a more substantial protection against corrosion: silicon nitride and boron nitride are potentially useful in this respect. Examples will be given of the successful application of these methods for the surface modification of metals and alloys, and developments in the

  2. Applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Gelerinter, E.; Spielberg, N.

    1980-01-01

    Wire adhesion in steel belted radial tires; carbon fibers and composite; cold welding, brazing, and fabrication; hydrogen production, separation, and storage; membrane use; catalysis; sputtering and texture; and ion beam implantation are discussed.

  3. IonCCD™ for direct position-sensitive charged-particle detection: from electrons and keV ions to hyperthermal biomolecular ions

    SciTech Connect

    Hadjar, Omar; Johnson, Grant E.; Laskin, Julia; Kibelka, Gottfried; Shill, Scott M.; Kuhn, Ken; Cameron, Chad; Kassan, Scott

    2011-04-01

    A novel charged-particle sensitive, pixel based detector array is described and its usage is demonstrated for a variety of applications, from detection of elemental particles (electrons) to hyper-thermal large biomolecular positive and negative ions including keV light atomic and molecular ions. The array detector is a modified light-sensitive charged coupled device (CCD). The IonCCDTM was engineered for direct charged particle detection by replacing the semi-conductor part of the CCD pixel by a conductor1. In contrast with the CCD, where the semi-conductive pixel is responsible for electron-hole pair formation upon photon bombardment, the IonCCD uses a capacitor coupled to the conductive electrode for direct charge integration. The detector can be operated from atmospheric pressure to high vacuum since no high voltages are needed. The IonCCD, presented in this work is an array of 2126 active pixels with 21 um pixel width and 3 um pixel gap. The detection area is 1.5x51mm2 where 1.5 mm and 51 mm are pixel and detector array length, respectively. The result is a one-dimensional position-sensitive detector with 24 um spatial resolution and 88 % pixel area ratio (PAR). In this work we demonstrate the capabilities and the performance of the detector. For the first time we show the direct detection of 250 eV electrons providing linearity response and detection efficiency of the IonCCD as function of electron beam current. Using positive ions from and electron impact source (E-I), we demonstrate that the detection efficiency of the IonCCD is virtually independent of particle energy [250 eV, 1250 eV], particle impact angle [45o, 90o] and particle flux. By combining the IonCCD with a double focusing sector field of Mattauch-Herzog geometry (M-H), we demonstrate fast acquisition of mass spectra in direct air sniffing mode. A first step towards fast in vivo breath analysis is presented. Detection of hyper-thermal biomolecular ions produced using an electrospray ionization

  4. EDITORIAL: Negative ion based neutral beam injection

    NASA Astrophysics Data System (ADS)

    Hemsworth, R. S.

    2006-06-01

    It is widely recognized that neutral beam injection (NBI), i.e. the injection of high energy, high power, beams of H or D atoms, is a flexible and reliable system that has been the main heating system on a large variety of fusion devices, and NBI has been chosen as one of the three heating schemes of the International Tokomak Reactor (ITER). To date, all the NBI systems but two have been based on the neutralization (in a simple gas target) of positive hydrogen or deuterium ions accelerated to <100 keV/nucleon. Above that energy the neutralization of positive ions falls to unacceptably low values, and higher energy neutral beams have to be created by the neutralization of accelerated negative ions (in a simple gas target), as this remains high (approx60%) up to >1 MeV/nucleon. Unfortunately H- and D- are difficult to create, and the very characteristic that makes them attractive, the ease with which the electron is detached from the ion, means that it is difficult to create high concentrations or fluxes of them, and it is difficult to avoid substantial, collisional, losses in the extraction and acceleration processes. However, there has been impressive progress in negative ion sources and accelerators over the past decade, as demonstrated by the two pioneering, operational, multi-megawatt, negative ion based, NBI systems at LHD (180 keV, H0) and JT-60U (500 keV, D0), both in Japan. Nevertheless, the system proposed for ITER represents a substantial technological challenge as an increase is required in beam energy, to 1 MeV, D0, accelerated ion (D-) current, to 40 A, accelerated current density, 200 A m-2 of D-, and pulse length, to 1 h. At the Fourth IAEA Technical Meeting on Negative Ion Based Neutral Beam Injectors, hosted by the Consorzio RFX, Padova, Italy, 9-11 May 2005, the status of the R&D aimed at the realization of the injectors for ITER was presented. Because of the importance of this development to the success of the ITER project, participants at that

  5. Experimental study of interactions of highly charged ions with atoms at keV energies. Progress report, February 16, 1993--April 15, 1994

    SciTech Connect

    Kostroun, V.O.

    1994-04-27

    Experimental study of low energy, highly charged ions with other atomic species requires an advanced ion source such as an electron beam ion source, EBIS or an electron cyclotron ion source, ECRIS. Five years ago we finished the design and construction of the Cornell superconducting solenoid, cryogenic EBIS (CEBIS). Since then, this source has been in continuous operation in a program whose main purpose is the experimental study of interactions of highly charged ions with atoms at keV energies. This progress report for the period February 16, 1993 to April 15, 1994 describes the work accomplished during this time in the form of short abstracts.

  6. Nanopore Sculpting with Low Energy Ion Beam of Noble Gases

    NASA Astrophysics Data System (ADS)

    Cai, Qun; Ledden, Brad; Krueger, Eric; Golovchenko, Jene; Li, Jiali

    2005-03-01

    Experiments show that 3keV Helium, Neon, Argon, Krypton, and Xenon ion beams can be used to controllably ``sculpt'' nanoscale features in silicon nitride films using a feedback controlled ion beam sculpting apparatus. Here we report nanopore ion beam sculpting effects that depend on the inert gas ion species. We demonstrate that: (1) all the noble gas ion beams enable single nanometer control of structural dimensions in nanopores; (2) every ion species above shows similar ion beam flux dependence of nanopore formation, (3) the thickness of nanopores sculpted with different inert gas ion beam is deferent. Computer simulations (with SRIM and TRIM) and an ``adatom'' surface diffusion model are employed to explain the dynamics of nanoscale dimension change by competing sputtering and surface mass transport processes induced by different ion beam irradiation. These experiments and theoretical work reveal the surface atomic transport phenomena in a quantitative way that allows the extraction of parameters such as the adatom surface diffusion coefficients and average travel distances.

  7. The beam diagnostic instruments in Beijing radioactive ion-beam facilities isotope separator on-line

    SciTech Connect

    Ma, Y. Cui, B.; Ma, R.; Tang, B.; Chen, L.; Huang, Q.; Jiang, W.

    2014-02-15

    The beam diagnostic instruments for Beijing Radioactive Ion-beam Facilities Isotope Separator On-Line are introduced [B. Q. Cui, Z. H. Peng, Y. J. Ma, R. G. Ma, B. Tang, T. Zhang, and W. S. Jiang, Nucl. Instrum. Methods 266, 4113 (2008); T. J. Zhang, X. L. Guan, and B. Q. Cui, in Proceedings of APAC 2004, Gyeongju, Korea, 2004, http://www.jacow.org , p. 267]. For low intensity ion beam [30–300 keV/1 pA–10 μA], the beam profile monitor, the emittance measurement unit, and the analyzing slit will be installed. For the primary proton beam [100 MeV/200 μA], the beam profile scanner will be installed. For identification of the nuclide, a beam identification unit will be installed. The details of prototype of the beam diagnostic units and some experiment results will be described in this article.

  8. Ion Beam Plasma Interactions in the ASTRAL Helicon Plasma Source.

    NASA Astrophysics Data System (ADS)

    Boivin, R. F.; Kesterson, A.; Kamar, O.; Lin, Y.; Munoz, J.; Wang, X.

    2008-11-01

    A 100 KeV NEC duoplasmatron is used to produce an energetic ion beam (10 KeV < E < 100 KeV). The beam is sent through plasmas produced by the ASTRAL helicon plasma source. The beam current and beam size are measured by a device combining Retarding Field Analyzer (RFA) and Faraday Cup (FC) features. ASTRAL produces bright intense He/Ne/Ar plasmas with the following parameters: ne = 1E11 -- 1E13 cm-3 and Te = 2 - 10 eV, B-field < 1.3 kGauss, rf power <= 2 kWatt. RF compensated Langmuir probes are used to measure Te and ne. Depending on the ion beam energy and the ratio of beam density over plasma density different wave instabilities will be generated within the plasmas. A real-time spectrum analyzer will be used to identify the wave instabilities and their evolution in the plasma. We will present early experimental results together with some preliminary theoretical simulation using 2D and 3D hybrid simulation codes. In these codes, ions are treated as fully kinetic particles while electrons are treated as a fluid. Both species are moving in a self-consistent electromagnetic field.

  9. Surface wet-ability modification of thin PECVD silicon nitride layers by 40 keV argon ion treatments

    NASA Astrophysics Data System (ADS)

    Caridi, F.; Picciotto, A.; Vanzetti, L.; Iacob, E.; Scolaro, C.

    2015-10-01

    Measurements of wet-ability of liquid drops have been performed on a 30 nm silicon nitride (Si3N4) film deposited by a PECVD reactor on a silicon wafer and implanted by 40 keV argon ions at different doses. Surface treatments by using Ar ion beams have been employed to modify the wet-ability. The chemical composition of the first Si3N4 monolayer was investigated by means of X-ray Photoelectron Spectroscopy (XPS). The surface morphology was tested by Atomic Force Microscopy (AFM). Results put in evidence the best implantation conditions for silicon nitride to increase or to reduce the wet-ability of the biological liquid. This permits to improve the biocompatibility and functionality of Si3N4. In particular experimental results show that argon ion bombardment increases the contact angle, enhances the oxygen content and increases the surface roughness.

  10. Cold atomic beam ion source for focused ion beam applications

    SciTech Connect

    Knuffman, B.; Steele, A. V.; McClelland, J. J.

    2013-07-28

    We report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1} and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1}. We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lower-brightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

  11. A microwave beam waveguide undulator for a brilliant above 100 keV photon source.

    SciTech Connect

    Kang, Y. W.

    1999-04-19

    For generation of photons above 100-keV with a magnetic field strength in the range 0.2-0.5 Tesla, an undulator wavelength {lambda}{sub u} shorter than 5 mm may be needed with beam in the Advanced Photon Source (APS) storage ring. A microwave beam waveguide undulator system has been investigated for generation of such light. The waveguide structure consists of two parallel reflector surfaces that can be derived from an elliptically cylindrical waveguide. The structure can support deflecting TE{sub m0} modes with very low microwave loss. A microwave ring resonator circuit employing the beam waveguide is considered to construct an undulator with the above requirement. Microwave properties of the beam waveguide structure have been investigated, and the design criteria for a microwave undulator are discussed.

  12. Fast Ion Beam Microscopy of Whole Cells

    NASA Astrophysics Data System (ADS)

    Watt, Frank; Chen, Xiao; Chen, Ce-Belle; Udalagama, Chammika Nb; Ren, Minqin; Pastorin, G.; Bettiol, Andrew

    2013-08-01

    The way in which biological cells function is of prime importance, and the determination of such knowledge is highly dependent on probes that can extract information from within the cell. Probing deep inside the cell at high resolutions however is not easy: optical microscopy is limited by fundamental diffraction limits, electron microscopy is not able to maintain spatial resolutions inside a whole cell without slicing the cell into thin sections, and many other new and novel high resolution techniques such as atomic force microscopy (AFM) and near field scanning optical microscopy (NSOM) are essentially surface probes. In this paper we show that microscopy using fast ions has the potential to extract information from inside whole cells in a unique way. This novel fast ion probe utilises the unique characteristic of MeV ion beams, which is the ability to pass through a whole cell while maintaining high spatial resolutions. This paper first addresses the fundamental difference between several types of charged particle probes, more specifically focused beams of electrons and fast ions, as they penetrate organic material. Simulations show that whereas electrons scatter as they penetrate the sample, ions travel in a straight path and therefore maintain spatial resolutions. Also described is a preliminary experiment in which a whole cell is scanned using a low energy (45 keV) helium ion microscope, and the results compared to images obtained using a focused beam of fast (1.2 MeV) helium ions. The results demonstrate the complementarity between imaging using low energy ions, which essentially produce a high resolution image of the cell surface, and high energy ions, which produce an image of the cell interior. The characteristics of the fast ion probe appear to be ideally suited for imaging gold nanoparticles in whole cells. Using scanning transmission ion microscopy (STIM) to image the cell interior, forward scattering transmission ion microscopy (FSTIM) to improve the

  13. Studies of Ion Beam Charge Neutralization by Ferroelectric Plasma Sources

    NASA Astrophysics Data System (ADS)

    Stepanov, A.; Gilson, E. P.; Grisham, L.; Davidson, R. C.

    2013-10-01

    Space-charge forces limit the possible transverse compression of high perveance ion beams that are used in ion-beam-driven high energy density physics applications; the minimum radius to which a beam can be focused is an increasing function of perveance. The limit can be overcome if a plasma is introduced in the beam path between the focusing element and the target in order to neutralize the space charge of the beam. This concept has been implemented on the Neutralized Drift Compression eXperiment (NDCX) at LBNL using Ferroelectric Plasma Sources (FEPS). In our experiment at PPPL, we propagate a perveance-dominated ion beam through a FEPS to study the effect of the neutralizing plasma on the beam envelope and its evolution in time. A 30-60 keV space-charge-dominated Argon beam is focused with an Einzel lens into a FEPS located at the beam waist. The beam is intercepted downstream from the FEPS by a movable Faraday cup that provides time-resolved 2D current density profiles of the beam spot on target. We report results on: (a) dependence of charge neutralization on FEPS plasma density; (b) effects on beam emittance, and (c) time evolution of the beam envelope after the FEPS pulse. Research supported by the U.S. Department of Energy.

  14. First storage of ion beams in the Double Electrostatic Ion-Ring Experiment: DESIREE

    SciTech Connect

    Schmidt, H. T.; Thomas, R. D.; Gatchell, M.; Rosen, S.; Reinhed, P.; Loefgren, P.; Braennholm, L.; Blom, M.; Bjoerkhage, M.; Baeckstroem, E.; Alexander, J. D.; Leontein, S.; Zettergren, H.; Liljeby, L.; Kaellberg, A.; Simonsson, A.; Hellberg, F.; Mannervik, S.; Larsson, M.; Geppert, W. D.; and others

    2013-05-15

    We report on the first storage of ion beams in the Double ElectroStatic Ion Ring ExpEriment, DESIREE, at Stockholm University. We have produced beams of atomic carbon anions and small carbon anion molecules (C{sub n}{sup -}, n= 1, 2, 3, 4) in a sputter ion source. The ion beams were accelerated to 10 keV kinetic energy and stored in an electrostatic ion storage ring enclosed in a vacuum chamber at 13 K. For 10 keV C{sub 2}{sup -} molecular anions we measure the residual-gas limited beam storage lifetime to be 448 s {+-} 18 s with two independent detector systems. Using the measured storage lifetimes we estimate that the residual gas pressure is in the 10{sup -14} mbar range. When high current ion beams are injected, the number of stored particles does not follow a single exponential decay law as would be expected for stored particles lost solely due to electron detachment in collision with the residual-gas. Instead, we observe a faster initial decay rate, which we ascribe to the effect of the space charge of the ion beam on the storage capacity.

  15. Sputtering and surface structure modification of gold thin films deposited onto silicon substrates under the impact of 20-160 keV Ar+ ions

    NASA Astrophysics Data System (ADS)

    Mammeri, S.; Ouichaoui, S.; Ammi, H.; Dib, A.

    2014-10-01

    The induced sputtering and surface state modification of Au thin films bombarded by swift Ar+ ions under normal incident angle have been studied over an energy range of (20-160) keV using three complementary techniques: Rutherford backscattering spectroscopy (RBS), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The sputtering yields determined by RBS measurements using a 2 MeV 4He+ ion beam were found to be consistent with previous data measured within the Ar+ ion energy region E ⩽ 50 keV, which are thus extended to higher bombarding energies. Besides, the SEM and XRD measurements clearly point out that the irradiated Au film surfaces undergo drastic modifications with increasing the Ar+ ion energy, giving rise to the formation of increasingly sized grains of preferred (1 1 1) crystalline orientations. The relevance of different sputtering yield models for describing experimental data is discussed with invoking the observed surface effects induced by the Ar+ ion irradiation.

  16. Focused Ion Beam Induced Effects on MOS Transistor Parameters

    SciTech Connect

    Abramo, Marsha T.; Antoniou, Nicholas; Campbell, Ann N.; Fleetwood, Daniel M.; Hembree, Charles E.; Jessing, Jeffrey R.; Soden, Jerry M.; Swanson, Scot E.; Tangyunyong, Paiboon; Vanderlinde, William E.

    1999-07-28

    We report on recent studies of the effects of 50 keV focused ion beam (FIB) exposure on MOS transistors. We demonstrate that the changes in value of transistor parameters (such as threshold voltage, V{sub t}) are essentially the same for exposure to a Ga+ ion beam at 30 and 50 keV under the same exposure conditions. We characterize the effects of FIB exposure on test transistors fabricated in both 0.5 {micro}m and 0.225 {micro}m technologies from two different vendors. We report on the effectiveness of overlying metal layers in screening MOS transistors from FIB-induced damage and examine the importance of ion dose rate and the physical dimensions of the exposed area.

  17. Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography

    NASA Astrophysics Data System (ADS)

    Vila-Comamala, Joan; Gorelick, Sergey; Guzenko, Vitaliy A.; Färm, Elina; Ritala, Mikko; David, Christian

    2010-07-01

    We investigated the fabrication of dense, high aspect ratio hydrogen silsesquioxane (HSQ) nanostructures by 100 keV electron beam lithography. The samples were developed using a high contrast developer and supercritically dried in carbon dioxide. Dense gratings with line widths down to 25 nm were patterned in 500 nm-thick resist layers and semi-dense gratings with line widths down to 10 nm (40 nm pitch) were patterned in 250 nm-thick resist layers. The dense HSQ nanostructures were used as molds for gold electrodeposition, and the semi-dense HSQ gratings were iridium-coated by atomic layer deposition. We used these methods to produce Fresnel zone plates with extreme aspect ratio for scanning transmission x-ray microscopy that showed excellent performance at 1.0 keV photon energy.

  18. Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography.

    PubMed

    Vila-Comamala, Joan; Gorelick, Sergey; Guzenko, Vitaliy A; Färm, Elina; Ritala, Mikko; David, Christian

    2010-07-16

    We investigated the fabrication of dense, high aspect ratio hydrogen silsesquioxane (HSQ) nanostructures by 100 keV electron beam lithography. The samples were developed using a high contrast developer and supercritically dried in carbon dioxide. Dense gratings with line widths down to 25 nm were patterned in 500 nm-thick resist layers and semi-dense gratings with line widths down to 10 nm (40 nm pitch) were patterned in 250 nm-thick resist layers. The dense HSQ nanostructures were used as molds for gold electrodeposition, and the semi-dense HSQ gratings were iridium-coated by atomic layer deposition. We used these methods to produce Fresnel zone plates with extreme aspect ratio for scanning transmission x-ray microscopy that showed excellent performance at 1.0 keV photon energy. PMID:20562479

  19. Statistical analysis of ripple morphology on Si surfaces due to 60 keV Ar+-ions

    NASA Astrophysics Data System (ADS)

    Garg, S. K.; Datta, D. P.; Basu, T.; Kanjilal, D.; Som, T.

    2016-03-01

    We report on analysis of ion-beam patterned surface morphology in terms of regularity of pattern shape and orientation, homogeneity over irradiated surface, and the effective increment in its surface area, which are critical in deciding the applications for the corresponding surface. As a case study, we have chosen Si surface, which is exposed to 60 keV Ar+-ions at different angles of incidence and ion fluence and have performed detail statistical analysis of topographic images of the patterned surfaces. By using the Scanning Probe Image Processor (SPIP) software, morphological parameters, viz. surface area ratio, texture direction index, texture aspect ratio, ratio of system correlation length to ripple wavelength, directional roughness exponents, and anisotropy ratio are calculated as functions of ion incidence angle and fluence. From angle-dependent studies, we observe that ripple patterns become more regular with increasing angle of incidence. On the other hand, fluence-dependent study of these parameters shows that ripple shapes are most regular for the fluence of 3 × 1018 ions cm-2, while ripples are most unidirectional for the fluence of 2 × 1018 ions cm-2. Our analysis method shows a route towards optimization of ion-patterned surfaces in terms of nanostructure quality or effective surface area, which is vital for applications. Further, using scaling analysis, we associate Si surfaces generated within particular angular or fluence range to different universality classes, which can help towards understanding of their formation mechanism.

  20. Negative hydrogen ion source for TOKAMAK neutral beam injector (invited)

    NASA Astrophysics Data System (ADS)

    Okumura, Y.; Fujiwara, Y.; Kashiwagi, M.; Kitagawa, T.; Miyamoto, K.; Morishita, T.; Hanada, M.; Takayanagi, T.; Taniguchi, M.; Watanabe, K.

    2000-02-01

    Intense negative ion source producing multimegawatt hydrogen/deuterium negative ion beams has been developed for the neutral beam injector (NBI) in TOKAMAK thermonuclear fusion machines. Negative ions are produced in a cesium seeded multi-cusp plasma generator via volume and surface processes, and accelerated with a multistage electrostatic accelerator. The negative ion source for JT-60U has produced 18.5 A/360 keV (6.7 MW) H- and 14.3 A/380 keV (5.4 MW) D- ion beams at average current densities of 11 mA/cm2 (H-) and 8.5 mA/cm2 (D-). A high energy negative ion source has been developed for the next generation TOKAMAK such as the International Thermonuclear Experimental Reactor (ITER). The source has demonstrated to accelerate negative ions up to 1 MeV, the energy required for ITER. Higher negative ion current density of more than 20 mA/cm2 was obtained in the ITER concept sources. It was confirmed that the consumption rate of cesium is small enough to operate the source for a half year in ITER-NBI without maintenance.

  1. Steady State Sputtering Yields and Surface Compositions of Depleted Uranium and Uranium Carbide bombarded by 30 keV Gallium or 16 keV Cesium Ions.

    SciTech Connect

    Siekhaus, W. J.; Teslich, N. E.; Weber, P. K.

    2014-10-23

    Depleted uranium that included carbide inclusions was sputtered with 30-keV gallium ions or 16-kev cesium ions to depths much greater than the ions’ range, i.e. using steady-state sputtering. The recession of both the uranium’s and uranium carbide’s surfaces and the ion corresponding fluences were used to determine the steady-state target sputtering yields of both uranium and uranium carbide, i.e. 6.3 atoms of uranium and 2.4 units of uranium carbide eroded per gallium ion, and 9.9 uranium atoms and 3.65 units of uranium carbide eroded by cesium ions. The steady state surface composition resulting from the simultaneous gallium or cesium implantation and sputter-erosion of uranium and uranium carbide were calculated to be U₈₆Ga₁₄, (UC)₇₀Ga₃₀ and U₈₁Cs₉, (UC)₇₉Cs₂₁, respectively.

  2. Tuning of wettability of PANI-GNP composites using keV energy ions

    NASA Astrophysics Data System (ADS)

    Lakshmi, G. B. V. S.; Avasthi, D. K.

    2016-07-01

    Polyaniline nanofiber composites with various nanomaterials have several applications in electrochemical biosensors. The surface properties of these composites coated electrodes play crucial role in enzyme absorption and analyte detection process. In the present study, Polyaniline-Graphene nanopowder (PANI-GNP) composites were prepared by rapid-mixing polymerization method. The films were prepared on ITO coated glass substrates and irradiated with 42 keV He+ ions produced by indigenously fabricated accelerator at IUAC, New Delhi. The films were characterized before and after irradiation by SEM, Raman spectroscopy and contact angle measurements. The as-prepared films show superhydrophilic nature and after irradiation the films show highly hydrophobic nature with water contact angle (135°). The surface morphology was studied by SEM and structural changes were studied by Raman spectra. The surface morphological modifications induced by keV energy ions helps in tuning the wettability at different ion fluences.

  3. Ion beam deposited protective films

    NASA Technical Reports Server (NTRS)

    Mirtich, M. J.

    1981-01-01

    Sputter deposition of adherent thin films on complex geometric surfaces by ion beam sources is examined in order to evaluate three different types of protective coatings for die materials. In the first experiment, a 30 cm diameter argon ion source was used to sputter deposit adherent metallic films up to eight microns thick on H-13 steel, and a thermal fatigue test specimen sputter deposited with metallic coatings one micron thick was immersed in liquid aluminum and cooled by water for 15,000 cycles to simulate operational environments. Results show that these materials do protect the steel by reducing thermal fatigue and thereby increasing die lifetime. The second experiment generated diamond-like carbon films using a dual beam ion source system that directed an eight cm argon ion source beam at the substrates. These films are still in the process of being evaluated for crystallinity, hardness and infrared absorption. The third experiment coated a fiber glass beam shield incorporated in the eight-cm diameter mercury ion thruster with molybdenum to ensure proper electrical and thermal properties. The coating maintained its integrity even under acceleration tests.

  4. Radially uniform circular sweep of ion beam

    SciTech Connect

    Akhmetov, T.D.; Davydenko, V.I.; Ivanov, A.A.; Kobets, V.V.; Medvedko, A.S.; Skorobogatov, D.N.; Tiunov, M.A.

    2006-03-15

    A spiral sweep of the ion beam was suggested to provide sufficiently uniform irradiation of a circular target. It is shown that if the beam radius is small enough, the radius of the beam center should increase as a square root of time to provide uniform radial irradiation of the target. In the complex for Boron Neutron Capture Therapy developed at the Budker Institute of Nuclear Physics, the proton beam sweep will be performed by a sweeper with uniform magnetic field with strength up to 500 G and axial length {approx}20 cm, rotating at 100-2000 Hz, and scanning over the radius at a 1-10 Hz frequency. The sweeper field is produced by four longitudinal flat current windings placed near the inner walls of a box-shaped yoke with the inner opening of a square cross section. A similar sweeping technique can be used in a 200 keV oxygen implanter, which is also under development at the Budker Institute.

  5. Photon, Electron and Secondary Ion Emission from Single C60 keV Impacts

    PubMed Central

    Fernandez-Lima, F. A.; Eller, M. J.; Verkhoturov, S. V.; Della-Negra, S.; Schweikert, E. A.

    2010-01-01

    This paper presents the first observation of coincidental emission of photons, electrons and secondary ions from individual C60 keV impacts. An increase in photon, electron and secondary ion yields is observed as a function of C60 projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV-Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution. PMID:21218166

  6. Beam Ion Driven Instabilities in NSTX

    SciTech Connect

    N.N. Gorelenkov; E. Belova; H.L. Berk; C.Z. Cheng; E. Fredrickson; W. Heidbrink; S. Kaye; G. Kramer

    2003-11-07

    A low-field, low-aspect-ratio device such as NSTX (National Spherical Torus Experiment) is an excellent testbed to study the ITER-relevant physics of fast-particle confinement that is of major importance for burning plasmas. The low Alfvin speed in NSTX offers a window to the super-Alfvinic regime expected in ITER. Effects such as the large FLR, orbit width, strong shaping, and high thermal and fast-ion betas make this effort a greater challenge. We report on the linear stability of different Alfvin eigenmode (AE) branches and compare theory with experimental data. Low-frequency MHD activities, {approx}100 kHz, on NSTX are often observed and identified as the toroidicity-induced AEs (TAE) driven by beam ions. Sometimes they are accompanied by beam ion losses in H-mode, high q(0) plasmas. Numerical analysis using the NOVA-K code shows good agreement with the experimental data. The TAE instability was compared in experiments on NSTX and DIII-D. With very similar plasma conditions, we tested the theoretical prediction that the toroidal mode number of the most unstable TAEs scales with the machine minor radius, n {approx} a. In NSTX, TAEs are observed with n = 1-2, whereas in DIII-D n = 4-7. The confirmation of n scaling validates the predictive capabilities of theoretical tools (NOVA-K) for studying ITER plasmas. In the high-frequency range, recent observations of rich sub-ion cyclotron frequency MHD activities in NSTX suggest that new instabilities are excited, which we identify as Global shear AEs (GAEs). Similar to the compressional AEs (CAEs), GAEs are destabilized by the Doppler-shifted cyclotron resonance in the presence of 80 keV neutral-beam injection. To simulate GAE/CAEs in realistic NSTX plasma conditions, we have developed a nonlinear hybrid kinetic-MHD code, HYM, which is capable of computing the mode structure, saturation, and energetic particle transport.

  7. Fast ion beam chopping system for neutron generators

    NASA Astrophysics Data System (ADS)

    Hahto, S. K.; Hahto, S. T.; Leung, K. N.; Reijonen, J.; Miller, T. G.; Van Staagen, P. K.

    2005-02-01

    Fast deuterium (D+) and tritium (T+) ion beam pulses are needed in some neutron-based imaging systems. A compact, integrated fast ion beam extraction and chopping system has been developed and tested at the Lawrence Berkeley National Laboratory for these applications, and beam pulses with 15ns full width at half maximum have been achieved. Computer simulations together with experimental tests indicate that even faster pulses are achievable by shortening the chopper voltage rise time. This chopper arrangement will be implemented in a coaxial neutron generator, in which a small point-like neutron source is created by multiple 120keV D+ ion beams hitting a titanium target at the center of the source.

  8. Fast ion beam chopping system for neutron generators

    SciTech Connect

    Hahto, S.K.; Hahto, S.T.; Leung, K.N.; Reijonen, J.; Miller, T.G.; Van Staagen, P.K.

    2005-02-01

    Fast deuterium (D{sup +}) and tritium (T{sup +}) ion beam pulses are needed in some neutron-based imaging systems. A compact, integrated fast ion beam extraction and chopping system has been developed and tested at the Lawrence Berkeley National Laboratory for these applications, and beam pulses with 15 ns full width at half maximum have been achieved. Computer simulations together with experimental tests indicate that even faster pulses are achievable by shortening the chopper voltage rise time. This chopper arrangement will be implemented in a coaxial neutron generator, in which a small point-like neutron source is created by multiple 120 keV D{sup +} ion beams hitting a titanium target at the center of the source.

  9. Multi-slit triode ion optical system with ballistic beam focusing

    NASA Astrophysics Data System (ADS)

    Davydenko, V.; Amirov, V.; Gorbovsky, A.; Deichuli, P.; Ivanov, A.; Kolmogorov, A.; Kapitonov, V.; Mishagin, V.; Shikhovtsev, I.; Sorokin, A.; Stupishin, N.; Karpushov, A. N.; Smirnov, A.; Uhlemann, R.

    2016-02-01

    Multi-slit triode ion-optical systems with spherical electrodes are of interest for formation of intense focused neutral beams for plasma heating. At present, two versions of focusing multi-slit triode ion optical system are developed. The first ion optical system forms the proton beam with 15 keV energy, 140 A current, and 30 ms duration. The second ion optical system is intended for heating neutral beam injector of Tokamak Configuration Variable (TCV). The injector produces focused deuterium neutral beam with 35 keV energy, 1 MW power, and 2 s duration. In the later case, the angular beam divergence of the neutral beam is 20-22 mrad in the direction across the slits of the ion optical system and 12 mrad in the direction along the slits.

  10. Multi-slit triode ion optical system with ballistic beam focusing.

    PubMed

    Davydenko, V; Amirov, V; Gorbovsky, A; Deichuli, P; Ivanov, A; Kolmogorov, A; Kapitonov, V; Mishagin, V; Shikhovtsev, I; Sorokin, A; Stupishin, N; Karpushov, A N; Smirnov, A; Uhlemann, R

    2016-02-01

    Multi-slit triode ion-optical systems with spherical electrodes are of interest for formation of intense focused neutral beams for plasma heating. At present, two versions of focusing multi-slit triode ion optical system are developed. The first ion optical system forms the proton beam with 15 keV energy, 140 A current, and 30 ms duration. The second ion optical system is intended for heating neutral beam injector of Tokamak Configuration Variable (TCV). The injector produces focused deuterium neutral beam with 35 keV energy, 1 MW power, and 2 s duration. In the later case, the angular beam divergence of the neutral beam is 20-22 mrad in the direction across the slits of the ion optical system and 12 mrad in the direction along the slits. PMID:26932031

  11. Optimization of the cell in the ion-optical system of a powerful source of protons with energy 15 keV

    NASA Astrophysics Data System (ADS)

    Sorokin, A. V.; Davydenko, V. I.; Deichuli, P. P.; Ivanov, A. A.

    2016-07-01

    We have described the results of numerical investigations of different versions of a three-electrode elementary slit cell for the formation a hydrogen ion beam with a relatively low energy and a high emission current density. The version of the cell chosen from the results of these investigations makes it possible to obtain a hydrogen atom beam with an energy of 15 keV, an ion current density of ~500 mA/cm2, and an angular divergence of 24 mrad.

  12. Linac4 low energy beam measurements with negative hydrogen ions

    SciTech Connect

    Scrivens, R. Bellodi, G.; Crettiez, O.; Dimov, V.; Gerard, D.; Granemann Souza, E.; Guida, R.; Hansen, J.; Lallement, J.-B.; Lettry, J.; Lombardi, A.; Midttun, Ø.; Pasquino, C.; Raich, U.; Riffaud, B.; Roncarolo, F.; Valerio-Lizarraga, C. A.; Wallner, J.; Yarmohammadi Satri, M.; Zickler, T.

    2014-02-15

    Linac4, a 160 MeV normal-conducting H{sup −} linear accelerator, is the first step in the upgrade of the beam intensity available from the LHC proton injectors at CERN. The Linac4 Low Energy Beam Transport (LEBT) line from the pulsed 2 MHz RF driven ion source, to the 352 MHz RFQ (Radiofrequency Quadrupole) has been built and installed at a test stand, and has been used to transport and match to the RFQ a pulsed 14 mA H{sup −} beam at 45 keV. A temporary slit-and-grid emittance measurement system has been put in place to characterize the beam delivered to the RFQ. In this paper a description of the LEBT and its beam diagnostics is given, and the results of beam emittance measurements and beam transmission measurements through the RFQ are compared with the expectation from simulations.

  13. Investigations of the emittance and brightness of ion beams from an electron beam ion source of the Dresden EBIS type

    SciTech Connect

    Silze, Alexandra; Ritter, Erik; Zschornack, Guenter; Schwan, Andreas; Ullmann, Falk

    2010-02-15

    We have characterized ion beams extracted from the Dresden EBIS-A, a compact room-temperature electron beam ion source (EBIS) with a permanent magnet system for electron beam compression, using a pepper-pot emittance meter. The EBIS-A is the precursor to the Dresden EBIS-SC in which the permanent magnets have been replaced by superconducting solenoids for the use of the source in high-ion-current applications such as heavy-ion cancer therapy. Beam emittance and brightness values were calculated from data sets acquired for a variety of source parameters, in leaky as well as pulsed ion extraction mode. With box shaped pulses of C{sup 4+} ions at an energy of 39 keV root mean square emittances of 1-4 mm mrad and a brightness of 10 nA mm{sup -2} mrad{sup -2} were achieved. The results meet the expectations for high quality ion beams generated by an electron beam ion source.

  14. Ion Beam Therapy in Europe

    NASA Astrophysics Data System (ADS)

    Kraft, Gerhard

    2009-03-01

    At present, seven facilities in Europe treat deep-seated tumors with particle beams, six with proton beams and one with carbon ions. Three of these facilities are in Moscow, St. Petersburg and Dubna, Russia. Other facilities include the TSL Uppsala, Sweden, CPO Orsay, France, and PSI Villigen, Switzerland, all for proton therapy, and GSI, Darmstadt, Germany, which utilizes carbon ions only. But only two of these facilities irradiate with scanned ion beams: the Paul Scherer Institute (PSI), Villigen (protons) and the Gesellschaft für Schwerionenforschung (GSI), Darmstadt. These two facilities are experimental units within physics laboratories and have developed the technique of intensity-modulated beam scanning in order to produce irradiation conforming to a 3-D target. There are three proton centers presently under construction in Munich, Essen and Orsay, and the proton facility at PSI has added a superconducting accelerator connected to an isocentric gantry in order to become independent of the accelerator shared with the physics research program. The excellent clinical results using carbon ions at National Institute of Radiological Science (NIRS) in Chiba and GSI have triggered the construction of four new heavy-ion therapy projects (carbon ions and protons), located in Heidelberg, Pavia, Marburg and Kiel. The projects in Heidelberg and Pavia will begin patient treatment in 2009, and the Marburg and Kiel projects will begin in 2010 and 2011, respectively. These centers use different accelerator designs but have the same kind of treatment planning system and use the same approach for the calculation of the biological effectiveness of the carbon ions as developed at GSI [1]. There are many other planned projects in the works. Do not replace the word "abstract," but do replace the rest of this text. If you must insert a hard line break, please use Shift+Enter rather than just tapping your "Enter" key. You may want to print this page and refer to it as a style

  15. Ion-beam-driven electrostatic ion cyclotron instabilities

    SciTech Connect

    Miura, A.; Okuda, H.; Ashour-Abdalla, M.

    1982-10-01

    We present results of numerical simulations on the electrostatic ion cyclotron instabilities driven by the ion beam parallel to the magnetic field. For the beam speed exceeding the thermal speed of background ions and the beam temperature much lower than the background ion temperature, it is found that the instability results in strong perpendicular heating and slowing down of parallel drift of the beam ions, leading to the saturation of the instability. Applications to plasma heating and space plasma physics are discussed.

  16. Focused ion beams in biology.

    PubMed

    Narayan, Kedar; Subramaniam, Sriram

    2015-11-01

    A quiet revolution is under way in technologies used for nanoscale cellular imaging. Focused ion beams, previously restricted to the materials sciences and semiconductor fields, are rapidly becoming powerful tools for ultrastructural imaging of biological samples. Cell and tissue architecture, as preserved in plastic-embedded resin or in plunge-frozen form, can be investigated in three dimensions by scanning electron microscopy imaging of freshly created surfaces that result from the progressive removal of material using a focused ion beam. The focused ion beam can also be used as a sculpting tool to create specific specimen shapes such as lamellae or needles that can be analyzed further by transmission electron microscopy or by methods that probe chemical composition. Here we provide an in-depth primer to the application of focused ion beams in biology, including a guide to the practical aspects of using the technology, as well as selected examples of its contribution to the generation of new insights into subcellular architecture and mechanisms underlying host-pathogen interactions. PMID:26513553

  17. Radial distribution of space-charge force in compensated positive-ion beams (invited)

    NASA Astrophysics Data System (ADS)

    Dölling, R.; Pozimski, J.; Gross, P.

    1998-02-01

    The space-charge compensated state of drifting dc beams of He+ ions of 10 keV ion energy and 0.14 and 1.5 mA current was determined with an electron beam probe, a rf resonance probe, the analysis of residual gas ion energies, and emittance measurement. The results are compatible with a basic model describing a two-dimensional multiplicity of possible self-consistent radial density distributions of beam ions, residual gas ions, and compensating electrons. The effects of electron drainage and beam current oscillations on space-charge compensation are pointed out.

  18. Development of polyatomic ion beam system using liquid organic materials

    NASA Astrophysics Data System (ADS)

    Takaoka, G. H.; Nishida, Y.; Yamamoto, T.; Kawashita, M.

    2005-08-01

    We have developed a new type of polyatomic ion beam system using liquid organic materials such as octane and ethanol, which consists of a capillary type of nozzle, an ionizer, a mass-separator and a substrate holder. Ion current extracted after ionization was 430 μA for octane and 200 μA for ethanol, respectively. The mass-analysis was realized using a compact E × B mass filter, and the mass-analyzed ion beams were transferred toward the substrate. The ion current density at the substrate was a few μA/cm2 for the mass-separated ion species. Interactions of polyatomic ion beams with silicon (Si) surfaces were investigated by utilizing the ellipsometry measurement. It was found that the damaged layer thickness irradiated by the polyatomic ions with a mass number of about 40 was smaller than that by Ar ion irradiation at the same incident energy and ion fluence. The result indicated that the rupture of polyatomic ions occurred upon its impact on the Si surface with an incident energy larger than a few keV. In addition, the chemical modification of Si surfaces such as wettability could be achieved by adjusting the incident energy for the ethanol ions, which included all the fragment ions.

  19. Upgrade of the electron beam ion trap in Shanghai

    NASA Astrophysics Data System (ADS)

    Lu, D.; Yang, Y.; Xiao, J.; Shen, Y.; Fu, Y.; Wei, B.; Yao, K.; Hutton, R.; Zou, Y.

    2014-09-01

    Over the last few years the Shanghai electron beam ion trap (EBIT) has been successfully redesigned and rebuilt. The original machine, developed under collaboration with the Shanghai Institute of Applied Physics, first produced an electron beam in 2005. It could be tuned with electron energies between 1 and 130 keV and beam current up to 160 mA. After several years of operation, it was found that several modifications for improvements were necessary to reach the goals of better electron optics, higher photon detection, and ion injection efficiencies, and more economical running costs. The upgraded Shanghai-EBIT is made almost entirely from Ti instead of stainless steel and achieves a vacuum of less than 10-10 Torr, which helps to minimize the loss of highly changed ions through charge exchange. Meanwhile, a more compact structure and efficient cryogenic system, and excellent optical alignment have been of satisfactory. The magnetic field in the central trap region can reach up till 4.8 T with a uniformity of 2.77 × 10-4. So far the upgraded Shanghai-EBIT has been operated up to an electron energy of 151 keV and a beam current of up to 218 mA, although promotion to even higher energy is still in progress. Radiation from ions as highly charged as Xe53+, 54+ has been produced and the characterization of current density is estimated from the measured electron beam width.

  20. Upgrade of the electron beam ion trap in Shanghai

    SciTech Connect

    Lu, D.; Yang, Y.; Xiao, J.; Shen, Y.; Fu, Y.; Wei, B.; Yao, K.; Hutton, R.; Zou, Y.

    2014-09-15

    Over the last few years the Shanghai electron beam ion trap (EBIT) has been successfully redesigned and rebuilt. The original machine, developed under collaboration with the Shanghai Institute of Applied Physics, first produced an electron beam in 2005. It could be tuned with electron energies between 1 and 130 keV and beam current up to 160 mA. After several years of operation, it was found that several modifications for improvements were necessary to reach the goals of better electron optics, higher photon detection, and ion injection efficiencies, and more economical running costs. The upgraded Shanghai-EBIT is made almost entirely from Ti instead of stainless steel and achieves a vacuum of less than 10{sup −10} Torr, which helps to minimize the loss of highly changed ions through charge exchange. Meanwhile, a more compact structure and efficient cryogenic system, and excellent optical alignment have been of satisfactory. The magnetic field in the central trap region can reach up till 4.8 T with a uniformity of 2.77 × 10{sup −4}. So far the upgraded Shanghai-EBIT has been operated up to an electron energy of 151 keV and a beam current of up to 218 mA, although promotion to even higher energy is still in progress. Radiation from ions as highly charged as Xe{sup 53+,} {sup 54+} has been produced and the characterization of current density is estimated from the measured electron beam width.

  1. Microstructural investigation of alumina implanted with 30 keV nitrogen ions

    NASA Astrophysics Data System (ADS)

    Shikha, Deep; Jha, Usha; Sinha, S. K.; Barhai, P. K.; Sarkhel, G.; Nair, K. G. M.; Dash, S.; Tyagi, A. K.; Kothari, D. C.

    2007-11-01

    Among ceramics, alumina is being widely used as biomaterials now these days. It is being used as hip joints, tooth roots etc. Ion implantation has been employed to modify its surface without changing it bulk properties. 30 keV nitrogen with varying ion dose ranging from 5 × 10 15 ions/cm 2 to 5 × 10 17 ions/cm 2 is implanted in alumina. Surface morphology has been studied with optical microscope and atomic force microscope (AFM). Improvement in brittleness has been observed with the increase in ion dose. Compound formation and changes in grain size have been studied using X-Ray diffraction (XRD). AlN compound formation is also observed by Fourier transform infrared spectroscopy (FTIR). The change in the grain size is related with the nanohardness and Hall-Petch relationship is verified.

  2. Neutral Beam Ion Loss Modelling for NSTX

    NASA Astrophysics Data System (ADS)

    Darrow, D. S.; Akers, R.; Kaye, S. M.; Mikkelsen, D. R.

    1999-11-01

    The loss of 80 keV D neutral beam ions to the walls has been modeled for a range of plasma conditions in NSTX using the EIGOL code[1]. Initial results of the code are in reasonable agreement with those from the LOCUST code[2]. Both codes predict loss fractions of 20% for a discharge with β_T=40% and q_0=2.6. Losses are strongly concentrated on the front face and edges of the high-harmonic fast wave antenna as it projects farther inward than other internal structures at the midplane. The edges of the passive stabilizer plates near the midplane are also subject to a large flux of lost beam ions under some conditions. The dependence of the loss upon the plasma density profile, I_p, and BT will be presented. [1] D. S. Darrow, et al., in Proceedings of the 26th EPS Conference on Controlled Fusion and Plasma Physics, Maastricht, The Netherlands, 14-18 June 1999. [2] R. Akers, et al., ibid.

  3. Materials processing with intense pulsed ion beams

    SciTech Connect

    Rej, D.J.; Davis, H.A.; Olson, J.C.

    1996-12-31

    We review research investigating the application of intense pulsed ion beams (IPIBs) for the surface treatment and coating of materials. The short range (0.1-10 {mu}m) and high-energy density (1-50 J/cm{sup 2}) of these short-pulsed ({le} 1 {mu}s) beams (with ion currents I = 5 - 50 kA, and energies E = 100 - 1000 keV) make them ideal to flash-heat a target surface, similar to the more familiar pulsed laser processes. IPIB surface treatment induces rapid melt and solidification at up to 10{sup 10} K/s to cause amorphous layer formation and the production of non-equilibrium microstructures. At higher energy density the target surface is vaporized, and the ablated vapor is condensed as coatings onto adjacent substrates or as nanophase powders. Progress towards the development of robust, high-repetition rate IPIB accelerators is presented along with economic estimates for the cost of ownership of this technology.

  4. Experimental optimization of beam quality extracted from a duoplasmatron proton ion source

    SciTech Connect

    Batygin, Y. K.; Draganic, I. N.; Fortgang, C. M.

    2014-10-01

    The LANSCE accelerator facility operates with two independent ion injectors for H⁺ and H⁻ particle beams. The H⁺ ion beam is formed using a duoplasmatron source followed by a 750 keV Cockroft-Walton accelerating column. Formation of an optimal plasma meniscus is an important feature for minimizing beam emittance, and maximizing beam brightness. A series of experiments were performed to find the optimal combination of extraction voltage and extracted current for the H⁺ beam. Measurements yielded the best ratio of beam perveance to Child–Langmuir perveance of 0.52 for maximizing beam brightness.

  5. Integration of scanning probes and ion beams

    SciTech Connect

    Persaud, A.; Park, S.J.; Liddle, J.A.; Schenkel, T.; Bokor, J.; Rangelow, I.

    2005-03-30

    We report the integration of a scanning force microscope with ion beams. The scanning probe images surface structures non-invasively and aligns the ion beam to regions of interest. The ion beam is transported through a hole in the scanning probe tip. Piezoresistive force sensors allow placement of micromachined cantilevers close to the ion beam lens. Scanning probe imaging and alignment is demonstrated in a vacuum chamber coupled to the ion beam line. Dot arrays are formed by ion implantation in resist layers on silicon samples with dot diameters limited by the hole size in the probe tips of a few hundred nm.

  6. Recent developments and upgrades in ion source technology and ion beam systems at HVE

    NASA Astrophysics Data System (ADS)

    Podaru, Nicolae C.; Mous, Dirk J. W.

    2016-03-01

    In this paper we discuss various ion sources used in particle accelerator systems dedicated to ion beam analysis techniques. Key performance and characteristics of some ion sources are discussed: emittance, brightness, gas consumption, sample consumption efficiency, lifetime, etc. For negative ion sources, we focus on the performance of volume H- ion sources (e.g. HVE model 358), the duoplasmatron negative ion source and the magnetically filtered multicusp volume sources (e.g. HVE model SO-120). The duoplasmatron ion source has been recently upgraded with a Ta filament to deliver up to 150 μA H- ion beams and in conjunction with the Na charge exchange canal up to 20 μA of He-. The available brightness from the duoplasmatron increased from 2 to 6 A m-2 rad-2 eV-1. The ion source has been incorporated in a stand-alone light ion injector, well suited to deliver 20-30 keV negative ion beams of H-, He-, C-, NHx- and O- to accelerate for most ion beam analysis techniques.

  7. ION BEAM FOCUSING MEANS FOR CALUTRON

    DOEpatents

    Backus, J.G.

    1959-06-01

    An ion beam focusing arrangement for calutrons is described. It provides a virtual focus of origin for the ion beam so that the ions may be withdrawn from an arc plasma of considerable width providing greater beam current and accuracy. (T.R.H.)

  8. Ion-beam Plasma Neutralization Interaction Images

    SciTech Connect

    Igor D. Kaganovich; Edward Startsev; S. Klasky; Ronald C. Davidson

    2002-04-09

    Neutralization of the ion beam charge and current is an important scientific issue for many practical applications. The process of ion beam charge and current neutralization is complex because the excitation of nonlinear plasma waves may occur. Computer simulation images of plasma neutralization of the ion beam pulse are presented.

  9. Relative dissociation fractions of CF4 under 15–30 keV H‑, C‑ and O‑ negative ion impact

    NASA Astrophysics Data System (ADS)

    Wang, Dedong; Fan, Yikui; Zhao, Zilong; Min, Guangxin; Zhang, Xuemei

    2016-08-01

    The relative dissociation fractions to produce the fragments of CF4 molecule are studied under the impact of 15 keV to 30 keV H‑, C‑ and O‑ negative ions. By using a time-of-flight mass spectrometer, the recoil ions and ion pairs originating from the target molecule CF4 are detected and identified in coincidence with scattered ions in q = 0 and q = +1 charge states. The fractions for the production of the fragment ions are obtained relative to the {\\text{CF} }3+ yield, while that of the ion pairs relative to the (C+, F+) coincidence yield.

  10. Production and characterization of ion beams from magnetically insulated diodes

    SciTech Connect

    Neri, J.M.

    1982-01-01

    The operation of magnetically insulated diodes and the characteristics of the resulting ion beams have been investigated using two pulsed power generators, LYNX at the 10/sup 9/W power level, and Neptune at the 10/sup 11/W power level. LYNX is a small magnetically insulated diode driven directly by a Marx bank. By changing the material used as the surface flashover ion source, the majority ion species generated by the diode could be chosen. Ion beams produced so far by this device are: protons, lithium, boron, carbon, sodium, strontium, and barium. Typical beam parameters for the ion beams are peak energies of 300 keV, current densities of 40 to 60 A/cm/sup 2/, and pulse durations of 300 to 400 nsec. The ion beam uniformity, divergence, and reproducibility were shown to be a function of the surface flashover source geometry. Finally, the LYNX ion beam was also used to anneal silicon crystals and other materials science experiments. The diode used on the Neptune generator was designed to study virtual cathode formation in a high power magnetically insulated diode. The physical cathode was replaced by electrons that ExB drift on the applied magnetic field lines. It was found that the best electrode configuration is one in which the electrons are required to only undergo the Hall drift to form the cathode. The divergence of the ion beam was examined with time-dependent and time-integrated shadowbox diagnostics. It was found that the intrinsic divergence of the ion beam does not have a strong directional dependence.

  11. Obliquely incident ion beam figuring

    NASA Astrophysics Data System (ADS)

    Zhou, Lin; Dai, Yifan; Xie, Xuhui; Li, Shengyi

    2015-10-01

    A new ion beam figuring (IBF) technique, obliquely incident IBF (OI-IBF), is proposed. In OI-IBF, the ion beam bombards the optical surface obliquely with an invariable incident angle instead of perpendicularly as in the normal IBF. Due to the higher removal rate in oblique incidence, the process time in OI-IBF can be significantly shortened. The removal rates at different incident angles were first tested, and then a test mirror was processed by OI-IBF. Comparison shows that in the OI-IBF technique with a 30 deg incident angle, the process time was reduced by 56.8%, while keeping the same figure correcting ability. The experimental results indicate that the OI-IBF technique is feasible and effective to improve the surface correction process efficiency.

  12. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y.S.

    1991-08-20

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used. 5 figures.

  13. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y. Simon

    1991-01-01

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used.

  14. Ion beam microtexturing of surfaces

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1981-01-01

    Some recent work in surface microtecturing by ion beam sputtering is described. The texturing is accomplished by deposition of an impurity onto a substrate while simultaneously bombarding it with an ion beam. A summary of the theory regarding surface diffusion of impurities and the initiation of cone formation is provided. A detailed experimental study of the time-development of individual sputter cones is described. A quasi-liquid coating was observed that apparently reduces the sputter rate of the body of a cone compared to the bulk material. Experimental measurements of surface diffusion activation energies are presented for a variety of substrate-seed combinations and range from about 0.3 eV to 1.2 eV. Observations of apparent crystal structure in sputter cones are discussed. Measurements of the critical temperature for cone formation are also given along with a correlation of critical temperature with substrate sputter rate.

  15. Detection of energetic electron (E greater than KeV) and ion fluxes (E greater than 97 KeV) from comet P/Halley by the Giotto experiment EPA on 1986 March 13/14

    NASA Astrophysics Data System (ADS)

    Kirsch, E.; McKenna-Lawlor, S.; Thompson, A.; O'Sullivan, D.; Neubauer, F. M.

    1988-03-01

    Relativistic electron fluxes (greater than 220, greater than 300 KeV) were recorded during the Giotto encounter with comet P/Halley from the inbound to the outbound bowshock. A strong enhancement in the greater than 300 KeV electron flux was measured about 1 hr after the outbound crossing of the bow shock. It is suggested that the electrons were strongly beamed by the magnetic field since they could only be detected in the hemisphere backward to the flight direction. Possible acceleration mechanisms for the relativistic particle population include magnetic field line reconnection at the front side of the magnetic pile-up region, induced electric fields and resonance processes of electrons with electrostatic lower hybrid waves or Langmuir waves. Also acceleration of ions and electrons by a quasiperpendicular shock formed downstream at the outbound bowshock must be considered.

  16. Ion beam inertial confinement target

    DOEpatents

    Bangerter, Roger O.; Meeker, Donald J.

    1985-01-01

    A target for implosion by ion beams composed of a spherical shell of frozen DT surrounded by a low-density, low-Z pusher shell seeded with high-Z material, and a high-density tamper shell. The target has various applications in the inertial confinement technology. For certain applications, if desired, a low-density absorber shell may be positioned intermediate the pusher and tamper shells.

  17. Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams

    PubMed Central

    2013-01-01

    Low secondary ion yields from organic and biological molecules are the principal limitation on the future exploitation of time of flight-secondary ion mass spectrometry (TOF-SIMS) as a surface and materials analysis technique. On the basis of the hypothesis that increasing the density of water related fragments in the ion impact zone would enhance proton mediated reactions, a prototype water cluster ion beam has been developed using supersonic jet expansion methodologies that enable ion yields using a 10 keV (H2O)1000+ beam to be compared with those obtained using a 10 keV Ar1000+ beam. The ion yields from four standard compounds, arginine, haloperidol, DPPC, and angiotensin II, have been measured under static+ and high ion dose conditions. Ion yield enhancements relative to the argon beam on the order of 10 or more have been observed for all the compounds such that the molecular ion yield per a 1 μm pixel can be as high as 20, relative to 0.05 under an argon beam. The water beam has also been shown to partially lift the matrix effect in a 1:10 mixture of haloperidol and dipalmitoylphosphatidylcholine (DPPC) that suppresses the haloperidol signal. These results provide encouragement that further developments of the water cluster beam to higher energies and larger cluster sizes will provide the ion yield enhancements necessary for the future development of TOF-SIMS. PMID:23718847

  18. Relative dissociation fractions of SF6 under impact of 15-keV to 30-keV H- and C- negative ions

    NASA Astrophysics Data System (ADS)

    Zhao, Zilong; Li, Junqin; Zhang, Xuemei

    2013-10-01

    The relative dissociation fractions for the production of fragment ions and ion pairs of SF6 are studied for H- and C- impact in the energy range from 15 to 30 keV. Recoil ions (SF4+, SF3+, SF2+, SF+, S+, F+, SF42+, SF22+) and ion pairs (SF3++F+,SF2++F+,SF++F+,S++F+, F++F+) are detected and identified in coincidence with scattered projectiles in two charge states (q=0 and q=+1) by using a time-of-flight spectrometer. The relative dissociation fractions are energy dependent for both single-electron-loss (SL) channel and double-electron-loss (DL) channel processes for certain negative ions. It is also found that the relative dissociation fractions for DL are larger than those for SL. In addition, the degree of fragmentation will become greater with a larger mass number of the projectiles at the same impact energy for the same electron-loss channel. A comparison of the time-of-flight spectra is made between that under negative-ion impact and that under electron impact, and it is found that the probability of production of SFn+ ions with n odd is higher than that of similar ions with n even, and the probability of production of SFn2+ ions with n even is higher than that of similar ions withn odd under H-, C-, positive-ion, and electron impact. We analyze this interesting phenomenon from the bond-dissociation energies of SFn+ and SFn2+. We also analyze the coincident time-of-flight spectra of two fragment ions resulting from double ionization of SF6 by H- and C- impact and describe the major dissociation pathways of SF62+ for H- and C- impact in the energy range from 15 to 30 keV.

  19. Energetic (>100 keV) 0/sup +/ ions in the plasma sheet

    SciTech Connect

    Ipavich, F.M.; Galvin, A.B.; Gloeckler, G.; Hovestadt, D.; Klecker, B.; Scholer, M.

    1984-05-01

    We present the first measurements of very energetic (112-157 keV) 0/sup +/ ions in the earth's magnetosphere. The observations were made with the UMd/MPE ULECA sensor on ISEE-1 on 5 March 1981 at geocentric distances approx.20 R/sub E/ in the earth's magnetotail. During this time period an Energetic Storm Particle event was observed by our nearly identical sensor on the ISEE-3 space-craft, located approx.250 R/sub E/ upstream of the earth's magnetosphere. The ISEE-1 sensor observed a similar temporal profile except for several sharp intensity enhancements, corresponding to substorm recoveries during which the plasma sheet engulfed the spacecraft. During these plasma sheet encounters we observe 0/sup +//H/sup +/ abundance ratios, at approx.130 keV, as large as 0.35. In between plasma sheet encounters with 0/sup +//H/sup +/ ratio at this energy is consistent with zero.

  20. Nanopillar growth by focused helium ion-beam-induced deposition.

    PubMed

    Chen, Ping; van Veldhoven, Emile; Sanford, Colin A; Salemink, Huub W M; Maas, Diederik J; Smith, Daryl A; Rack, Philip D; Alkemade, Paul F A

    2010-11-12

    A 25 keV focused helium ion beam has been used to grow PtC nanopillars on a silicon substrate by beam-induced decomposition of a (CH(3))(3)Pt(C(P)CH(3)) precursor gas. The ion beam diameter was about 1 nm. The observed relatively high growth rates suggest that electronic excitation is the dominant mechanism in helium ion-beam-induced deposition. Pillars grown at low beam currents are narrow and have sharp tips. For a constant dose, the pillar height decreases with increasing current, pointing to depletion of precursor molecules at the beam impact site. Furthermore, the diameter increases rapidly and the total pillar volume decreases slowly with increasing current. Monte Carlo simulations have been performed with realistic values for the fundamental deposition processes. The simulation results are in good agreement with experimental observations. In particular, they reproduce the current dependences of the vertical and lateral growth rates and of the volumetric deposition efficiency. Furthermore, the simulations reveal that the vertical pillar growth is due to type-1 secondary electrons and primary ions, while the lateral outgrowth is due to type-2 secondary electrons and scattered ions. PMID:20947951

  1. Neurosurgical applications of ion beams

    NASA Astrophysics Data System (ADS)

    Fabrikant, Jacob I.; Levy, Richard P.; Phillips, Mark H.; Frankel, Kenneth A.; Lyman, John T.

    1989-04-01

    The program at Donner Pavilion has applied nuclear medicine research to the diagnosis and radiosurgical treatment of life-threatening intracranial vascular disorders that affect more than half a million Americans. Stereotactic heavy-charged-particle Bragg peak radiosurgery, using narrow beams of heavy ions, demonstrates superior biological and physical characteristics in brain over X-and γ-rays, viz., improved dose distribution in the Bragg peak and sharp lateral and distal borders and less scattering of the beam. Examination of CNS tissue response and alteration of cerebral blood-flow dynamics related to heavy-ion Bragg peak radiosurgery is carried out using three-dimensional treatment planning and quantitative imaging utilizing cerebral angiography, computerized tomography (CT), magnetic resonance imaging (MRI), cine-CT, xenon X-ray CT and positron emission tomography (PET). Also under examination are the physical properties of narrow heavy-ion beams for improving methods of dose delivery and dose distribution and for establishing clinical RBE/LET and dose-response relationships for human CNS tissues. Based on the evaluation and treatment with stereotactically directed narrow beams of heavy charged particles of over 300 patients, with cerebral angiography, CT scanning and MRI and PET scanning of selected patients, plus extensive clinical and neuroradiological followup, it appears that Stereotactic charged-particle Bragg peak radiosurgery obliterates intracranial arteriovenous malformations or protects against rebleeding with reduced morbidity and no mortality. Discussion will include the method of evaluation, the clinical research protocol, the Stereotactic neuroradiological preparation, treatment planning, the radiosurgery procedure and the protocol for followup. Emphasis will be placed on the neurological results, including the neuroradiological and clinical response and early and late delayed injury in brain leading to complications (including vasogenic edema

  2. Effect of 200 keV argon ion implantation on refractive index of polyethylene terepthlate (PET)

    NASA Astrophysics Data System (ADS)

    Kumar, Rajiv; Chawla, Mahak; Rubi, Sharma, Annu; Aggarwal, Sanjeev; Kumar, Praveen; Kanjilal, D.

    2012-06-01

    In the present work, the effect of argon ion implantation has been studied on the refractive index of PET. The specimens were implanted at 200 keV with argon ions in the fluence range of 1×1015 to 1×1017 ions cm-2. The refractive indices have been found to increase with implantation dose and wavelength (in visible region) obtained by using UV-visible spectroscopy. Also a drastic decrease in optical band gap (from 3.63 eV to 1.48eV) and increase in Urbach energy (from 0.29 eV to 3.70 eV) with increase in implantation dose has been observed. The possible correlation between the changes observed in the refractive indices and the Urbachenergyhave been discussed.

  3. A Nanoscale-Localized Ion Damage Josephson Junction Using Focused Ion Beam and Ion Implanter.

    PubMed

    Wu, C H; Ku, W S; Jhan, F J; Chen, J H; Jeng, J T

    2015-05-01

    High-T(c) Josephson junctions were fabricated by nanolithography using focused ion beam (FIB) milling and ion implantation. The junctions were formed in a YBa2Cu3O7-x, thin film in regions defined using a gold-film mask with 50-nm-wide (top) slits, engraved by FIB. The focused ion beam system parameters for dwell time and passes were set to remove gold up to a precise depth. 150 keV oxygen ions were implanted at a nominal dose of up to 5 x 10(13) ions/cm2 into YBa2Cu3O7-x microbridges through the nanoscale slits. The current-voltage curves of the ion implantation junctions exhibit resistive-shunted-junction-like behavior at 77 K. The junction had an approximately linear temperature dependence of critical current. Shapiro steps were observed under microwave irradiation. A 50-nm-wide slit and 0-20-nm-thick buffer layers were chosen in order to make Josephson junctions due to the V-shape of the FIB-milled trench. PMID:26504998

  4. The production and use of ultralow energy ion beams

    NASA Astrophysics Data System (ADS)

    Goldberg, R. D.; Armour, D. G.; van den Berg, J. A.; Cook, C. E. A.; Whelan, S.; Zhang, S.; Knorr, N.; Foad, M. A.; Ohno, H.

    2000-02-01

    An ion accelerator, purpose built to produce beams at energies down to 10 eV with current densities in the 10-100 μA cm-2 range, is described. Fitted with dual ion source assemblies, the machine enables ultralow energy ion implantation and the growth of films and multilayers to be carried out under highly controlled conditions. The accelerator delivers ion beams into an ultrahigh vacuum chamber, containing a temperature controlled target stage (range -120 to +1350 °C), where they are used to study the fundamental physics relating to the interaction of ultralow energy ions with surfaces. This knowledge underlies a wide range of ion-beam and plasma-based technologies and, to illustrate its importance, results are presented from investigations designed to determine the optimum conditions for the growth of diamond-like and aluminum films by ion-beam deposition and the formation of ultrashallow junctions in semiconductors by 2.5 keV As+ implantation. The later investigation shows how transient arsenic diffusion, which occurs during post-implant thermal processing, can be controlled by manipulating the substrate temperature during implantation.

  5. Neutralization of Space Charge Effects for Low Energy Ion Beams Using Field Emitters

    SciTech Connect

    Nicolaescu, D.; Sakai, S.; Matsuda, K.; Gotoh, Y.; Ishikawa, J.

    2008-11-03

    The paper presents models and computations for neutralization of space charge effects using electrons provided by field emitter arrays. Different ion species ({sup 11}B{sup +},{sup 31}P{sup +},{sup 75}As{sup +}) with energy in the range E{sub ion} = 200 eV-1 keV have been considered. The ion beam divergence is studied as a function of electron beam geometry and physical parameters (electron and ion energy, electron/ion current ratio I{sub el}/I{sub ion}). The electron beam geometry takes into account electron source positions and initial launching angles. It is shown that optimal ion beam neutralization occurs for low energy electrons emitted parallel to the ion beam.

  6. Focused electron and ion beam systems

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  7. Ion-beam-induced nanodots formation from Au/Si thin films on quartz surface

    NASA Astrophysics Data System (ADS)

    Datta, D. P.; Siva, V.; Singh, A.; Joshi, S. R.; Kanjilal, D.; Sahoo, P. K.

    2016-07-01

    We report the synthesis of Si nanodots on quartz surface using ion irradiation. When a bi-layer of ultrathin Au and Si on quartz surface is irradiated by 500 keV Xe-ion beam, the bi-layer spontaneously transforms into nanodots at a fluence of 5 × 1014 ions cm-2. The spatial density and diameter of the nanodots are reduced with increase in applied ion fluence. The nanostructures exhibit photoluminescence in the visible range at room temperature where the intensity and wavelength depends upon ion fluence. The observed evolution seems to be correlated to ion beam mixing induced silicide formation at Au-Si interface.

  8. Characteristics of a long-pulse (30-s), high-power (4-MW) ion source for neutral beam injection

    SciTech Connect

    Menon, M.M.; Barber, G.C.; Combs, S.K.; Dagenhart, W.K.; Gardner, W.L.; Haselton, H.H.; Moeller, J.A.; Ponte, N.S.; Ryan, P.M.; Schechter, D.E.

    1983-01-01

    A quasi-steady-state ion source has been developed for neutral beam injection applications. It is of the duoPIGatron type designed for delivering 50 A of hydrogen ions at 80 keV for 30-s-long pulses. Ion beams of 40 A at 75 keV were extracted for pulse lengths up to 30 s, maintaining excellent optical quality in the beam for the entire pulse duration. The design features and operational characteristics of the ion source are elaborated.

  9. A microwave plasma cathode electron gun for ion beam neutralization

    NASA Astrophysics Data System (ADS)

    Fusellier, C.; Wartski, L.; Aubert, J.; Schwebel, C.; Coste, Ph.; Chabrier, A.

    1998-02-01

    It is well known that there exist two distinct types of ion beam neutralization, viz., charge and current neutralization. We have designed and studied a versatile and compact microwave plasma (MP) cathode electron gun dedicated to charge as well as current neutralization. Unlike the conventional hot cathode neutralizer, this MP cathode allows operation of the electron gun in a reactive gaseous environment when it is eventually associated with an electron cyclotron resonance (ECR) ion gun. Charge neutralization can be easily carried out by extracting from the MP cathode through a 1 mm diameter hole, a 35 mA electron beam under a 20 V voltage; the MP cathode being fed with a 75 W microwave power at 2.45 GHz. Higher beam intensities could be obtained using a multiaperture thin plate. Electron beam intensities as high as 300 mA and energies of 2 keV needed for current neutralization, e.g., when an ion beam impinges onto a thick dielectric surface, are obtained via a two-stage arrangement including an anodic chamber associated with a set of three monoaperture plates for the electron beam extraction. Transport of 200-2000 eV electron beams is ensured using focusing optics composed of three aligned tubes 6 cm in diameter and unsymmetrically polarized.

  10. Pseudo ribbon metal ion beam source

    SciTech Connect

    Stepanov, Igor B. Ryabchikov, Alexander I.; Sivin, Denis O.; Verigin, Dan A.

    2014-02-15

    The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface.

  11. Nanostructured Arrays Formed by Finely Focused Ion Beams

    SciTech Connect

    Budai, J.D.; Datsos, P.G.; Feldman, L.C.; Heinig, K.-H.; Meldrum, A.; Strobel, M.; Thomas, K.A.; Warmack, R.J.; White, C.W.; Zuhr, R.A.

    1998-11-30

    Amorphous, polycrystalline, and single crystal nanometer dimension particles can be formed in a variety of substrates by ion implantation and subsequent annealing. Such composite colloidal materials exhibit unique optical properties that could be useful in optical devices, switches, and waveguides. However colloids formed by blanket implantation are not uniform in size due to the nonuniform density of the implant, resulting in diminution of the size dependent optical properties. The object of the present work is to form more uniform size particles arranged in a 2-dimensional lattice by using a finely focused ion beam to implant identical ion doses only into nanometer size regions located at each point of a rectangular lattice. Initial work is being done with a 30 keV Ga beam implanted into Si. Results of particle formation as a function of implant conditions as analyzed by Rutherford backscattering, x-ray analysis, atomic force microscopy, and both scanning and transmission electron microscopy will be presented and discussed.

  12. The electromagnetic ion cyclotron beam anisotropy instability

    NASA Technical Reports Server (NTRS)

    Peter Gary, S.; Schriver, David

    1987-01-01

    Electromagnetic instabilities driven by an anisotropic, relatively cool ion beam are studied for the case in which both the beam and the instabilities propagate parallel or antiparallel to a uniform magnetic field. At modest beam-core relative drift speeds, sufficiently large perpendicular-to-parallel beam temperature ratios and sufficiently large plasma beta, the mode of fastest growth rate is the ion cyclotron beam anisotropy instability. Because the right-hand polarized waves observed upstream of slow shocks in the earth's magnetotail can lead to the appropriate beam anisotropy, the ion cyclotron instability may be present and account for the left-hand polarized magnetic waves observed there. Also, because of its relatively low phase speed, the ion cyclotron beam anisotropy instability may provide the scattering necessary for ion Fermi acceleration at slow shocks of sufficiently high plasma beta.

  13. Negative Ion Beam Extraction and Emittance

    SciTech Connect

    Holmes, Andrew J. T.

    2007-08-10

    The use of magnetic fields to both aid the production of negative ions and suppress the co-extracted electrons causes the emittance and hence the divergence of the negative ion beam to increase significantly due to the plasma non-uniformity from jxB drift. This drift distorts the beam-plasma meniscus and experimental results of the beam emittance are presented, which show that non-uniformity causes the square of the emittance to be proportional to the 2/3 power of the extracted current density. This can cause the divergence of the negative ion beam to be significantly larger than its positive ion counterpart. By comparing results from positive and negative ion beam emittances from the same source, it is also possible to draw conclusions about their vulnerability to magnetic effects. Finally emittances of caesiated and un-caesiated negative ion beams are compared to show how the surface and volume modes of production interact.

  14. Oxygen incorporation in polyethylene implanted with 150 keV Sb+ ions

    NASA Astrophysics Data System (ADS)

    Hnatowicz, V.; Kvítek, J.; Švorčík, V.; Rybka, V.; Popok, V.

    1994-06-01

    Samples of polyethylene (PE) loaded with carbon black up to 8 wt.% and implanted with 150 keV Sb+ ions to the doses from 2×1013-2×1015 cm-2 were studied using standard Rutherford Back Scattering (RBS) technique. On the PE samples implanted to the doses above 2×1014 cm-2, a considerable surface carbonization is observed. The measured parameters of the Sb depth profile are compared with theoretical TRIM estimations. The projected range is by 25% lower than the theoretical one and the range straggling is about twice of that predicted. The differences are explained by stepwise polymer degradation during the ion bombardment. Strong oxidation of the ion implanted polymers is also observed. The oxygen depth profiles from the sample surface up to the depth comparable with Sb+ ion range evolve from nearly uniform one for low ion doses to highly non-uniform one for doses above 1×1015 cm-2. The total oxygen content in the sample surface layer 300 nm thick reaches a maximum for the doses of (1-2)×1014 cm-2.

  15. Molecular Ion Beam Transportation for Low Energy Ion Implantation

    SciTech Connect

    Kulevoy, T. V.; Kropachev, G. N.; Seleznev, D. N.; Yakushin, P. E.; Kuibeda, R. P.; Kozlov, A. V.; Koshelev, V. A.; Hershcovitch, A.; Johnson, B. M.; Gushenets, V. I.; Oks, E. M.; Polozov, S. M.; Poole, H. J.

    2011-01-07

    A joint research and development of steady state intense boron ion sources for 100's of electron-volt ion implanters has been in progress for the past five years. Current density limitation associated with extracting and transporting low energy ion beams result in lower beam currents that in turn adversely affects the process throughput. The transport channel with electrostatic lenses for decaborane (B{sub 10}H{sub 14}) and carborane (C{sub 2}B{sub 10}H{sub 12}) ion beams transportation was developed and investigated. The significant increase of ion beam intensity at the beam transport channel output is demonstrated. The transport channel simulation, construction and experimental results of ion beam transportation are presented.

  16. Mapping of ion beam induced current changes in FinFETs

    SciTech Connect

    Weis, C. D.; Schuh, A.; Batra, A.; Persaud, A.; Rangelow, I. W.; Bokor, J.; Lo, C. C.; Cabrini, S.; Olynick, D.; Duhey, S.; Schenkel, T.

    2008-09-30

    We report on progress in ion placement into silicon devices with scanning probealignment. The device is imaged with a scanning force microscope (SFM) and an aligned argon beam (20 keV, 36 keV) is scanned over the transistor surface. Holes in the lever of the SFM tip collimate the argon beam to sizes of 1.6 mu m and 100 nm in diameter. Ion impacts upset the channel current due to formation of positive charges in the oxide areas. The induced changes in the source-drain current are recorded in dependence of the ion beam position in respect to the FinFET. Maps of local areas responding to the ion beam are obtained.

  17. Simulation of ion beam bombardment using Bayfol CR 6-2

    NASA Astrophysics Data System (ADS)

    Radwan, S. I.; Shehata, M. M.; El-Khabeary, H.; Helal, A. G.

    2016-04-01

    In this work, the simulation of ion beam bombardment in Bayfol CR 6-2 polymer at energies varies from 5 keV to 45 keV was determined. The simulation process was made by multiply charged copper and lead ions of different incident angles. The open source computer code SRIM 3D was used for the simulation to determine the ion beam penetrability into the Bayfol CR 6-2 specimens. The range, recoil distribution and total damage of copper and lead ions using Bayfol 6-2 specimens at different energies and incident angles were studied. It was found that the ion range, recoil distribution and total damage at different incident angles on Bayfol 6-2 specimens increases by increasing the ions energy using copper and lead ions respectively.

  18. Plasma formed ion beam projection lithography system

    SciTech Connect

    Leung, Ka-Ngo; Lee, Yung-Hee Yvette; Ngo, Vinh; Zahir, Nastaran

    2002-01-01

    A plasma-formed ion-beam projection lithography (IPL) system eliminates the acceleration stage between the ion source and stencil mask of a conventional IPL system. Instead a much thicker mask is used as a beam forming or extraction electrode, positioned next to the plasma in the ion source. Thus the entire beam forming electrode or mask is illuminated uniformly with the source plasma. The extracted beam passes through an acceleration and reduction stage onto the resist coated wafer. Low energy ions, about 30 eV, pass through the mask, minimizing heating, scattering, and sputtering.

  19. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Wang, Joseph

    2010-05-21

    Ion beam emission/neutralization is one of the most fundamental problems in spacecraft plasma interactions and electric propulsion. Although ion beam neutralization is readily achieved in experiments, the understanding of the underlying physical process remains at a rather primitive level. No theoretical or simulation models have convincingly explained the detailed neutralization mechanism, and no conclusions have been reached. This paper presents a fully kinetic simulation of ion beam neutralization and plasma beam propagation and discusses the physics of electron-ion coupling and the resulting propagation of a neutralized mesothermal plasma.

  20. The Electron Beam Ion Source (EBIS)

    ScienceCinema

    Brookhaven Lab

    2010-01-08

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  1. The Electron Beam Ion Source (EBIS)

    SciTech Connect

    Brookhaven Lab

    2009-06-09

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  2. Transverse beam dynamics studies of a heavy ion induction linac

    SciTech Connect

    Garvey, T.; Eylon, S.; Fessenden, T.J.; Hahn, K.; Henestroza, E.; Keefe, D.

    1990-08-01

    The multiple beam induction linac experiment (MBE-4) was built to study the accelerator physics of the low energy, electrostatically focussed end of a driver for heavy ion inertial confinement fusion. In this machine four beams of Cs{sup +} ions are accelerated through 24 common induction gaps while being focussed in separate AG focussing channels. Each channel consists of a syncopated FODO lattice of 30 periods. We report results of the most recent studies of the transverse beam dynamics of a single drifting (180 keV) beam in this machine. The dependence of the emittance on the zero-current phase advance shows systematic variations which may be understood in the light of previous theoretical work on this topic. This result, unique to the beam parameters of a linac for heavy ion fusion, will be discussed in the context of its implications for a driver design. In addition we will discuss recent measurements of the motion of the beam centroid through the linac. These measurements, coupled with simulations, have proven to be a powerful tool in determining the presence of misalignment errors in the lattice of the accelerator. 6 refs., 3 figs.

  3. Treatment Planning for Ion Beam Therapy

    NASA Astrophysics Data System (ADS)

    Greilich, Steffen; Jäkel, Oliver

    2010-01-01

    Beams of charged particles offer an improved dose conformation to the target volume as compared to photon radiotherapy, with better sparing of normal tissue structures close to the target. In addition, beams of ions heavier than helium exhibit a strong increase of the Linear Energy Transfer (LET) in the Bragg peak as compared to the entrance region, resulting in a higher biological efficiency in the target region. These physical and biological properties make ion beams more favorable for radiation therapy of cancer than photon beams. As a consequence, particle therapy with heavy ions has gained increasing interest worldwide. To fully benefit from the advantages of ion radiotherapy, appropriate treatment planning has to be done—taking into account the specific characteristics of ion beams, e.g. the inverted depth-dose profile, nuclear fragmentation, and increase radiobiological effectiveness. This paper describes in brief the approach taken at GSI Darmstadt and HIT Heidelberg for an active 3D beam scanning system.

  4. Laser cooling of a stored ion beam: A first step towards crystalline beams

    SciTech Connect

    Hangst, J.S.

    1992-09-01

    This report discusses: a brief introduction to storage rings; crystalline beams; laser cooling of ion beams; description of astrid-the experimental setup; first experiments with lithium 7 ion beam; experiments with erbium 166 ion beams; further experiments with lithium 7 ion beams; beam dynamics, laser cooling,and crystalline beams in astrid; possibilities for further study in astrid.

  5. Ion optics of RHIC electron beam ion source

    SciTech Connect

    Pikin, A.; Alessi, J.; Beebe, E.; Kponou, A.; Okamura, M.; Raparia, D.; Ritter, J.; Tan, Y.; Kuznetsov, G.

    2012-02-15

    RHIC electron beam ion source has been commissioned to operate as a versatile ion source on RHIC injection facility supplying ion species from He to Au for Booster. Except for light gaseous elements RHIC EBIS employs ion injection from several external primary ion sources. With electrostatic optics fast switching from one ion species to another can be done on a pulse to pulse mode. The design of an ion optical structure and the results of simulations for different ion species are presented. In the choice of optical elements special attention was paid to spherical aberrations for high-current space charge dominated ion beams. The combination of a gridded lens and a magnet lens in LEBT provides flexibility of optical control for a wide range of ion species to satisfy acceptance parameters of RFQ. The results of ion transmission measurements are presented.

  6. TOPICAL REVIEW Dosimetry for ion beam radiotherapy

    NASA Astrophysics Data System (ADS)

    Karger, Christian P.; Jäkel, Oliver; Palmans, Hugo; Kanai, Tatsuaki

    2010-11-01

    Recently, ion beam radiotherapy (including protons as well as heavier ions) gained considerable interest. Although ion beam radiotherapy requires dose prescription in terms of iso-effective dose (referring to an iso-effective photon dose), absorbed dose is still required as an operative quantity to control beam delivery, to characterize the beam dosimetrically and to verify dose delivery. This paper reviews current methods and standards to determine absorbed dose to water in ion beam radiotherapy, including (i) the detectors used to measure absorbed dose, (ii) dosimetry under reference conditions and (iii) dosimetry under non-reference conditions. Due to the LET dependence of the response of films and solid-state detectors, dosimetric measurements are mostly based on ion chambers. While a primary standard for ion beam radiotherapy still remains to be established, ion chamber dosimetry under reference conditions is based on similar protocols as for photons and electrons although the involved uncertainty is larger than for photon beams. For non-reference conditions, dose measurements in tissue-equivalent materials may also be necessary. Regarding the atomic numbers of the composites of tissue-equivalent phantoms, special requirements have to be fulfilled for ion beams. Methods for calibrating the beam monitor depend on whether passive or active beam delivery techniques are used. QA measurements are comparable to conventional radiotherapy; however, dose verification is usually single field rather than treatment plan based. Dose verification for active beam delivery techniques requires the use of multi-channel dosimetry systems to check the compliance of measured and calculated dose for a representative sample of measurement points. Although methods for ion beam dosimetry have been established, there is still room for developments. This includes improvement of the dosimetric accuracy as well as development of more efficient measurement techniques.

  7. Mechanisms of O2 Sputtering from Water Ice by keV Ions

    NASA Technical Reports Server (NTRS)

    Teolis, B. D.; Vidal, R. A.; Shi, J.; Baragiola, R. A.

    2005-01-01

    We have conducted experiments on the sputtering of water ice by 100 keV Ar(+) between 20 and 150 K. Our findings indicate that the temperature dependence of the total sputtering yield is heavily influenced by the thermal and irradiation history of the ice, showing a complex dependence on irradiation fluence that is correlated to the ejection of O2 molecules. The results suggest that O2 produced by the ions inside the ice diffuses to the surface where it is trapped and then ejected via sputtering or thermal desorption. A high concentration of O2 can trap in a subsurface layer during bombardment at 130 K, which we relate to the formation of hydrogen and its escape from that region. A simple model allows us to determine the depth profile of the absolute concentration of O2 trapped in the ice.

  8. Heavy ion beams for inertial fusion

    SciTech Connect

    Godlove, T.F.; Herrmannsfeldt, W.B.

    1980-05-01

    The United States' program in inertial confinement fusion (ICF) is described in this paper, with emphasis on the studies of the use of intense high energy beams of heavy ions to provide the power and energy needed to initiate thermonuclear burn. Preliminary calculations of the transport of intense ion beams in an electrostatic quadrupole focussing structure are discussed.

  9. Broad beam gas ion source with hollow cathode discharge and four-grid accelerator system

    NASA Astrophysics Data System (ADS)

    Tang, Deli; Pu, Shihao; Huang, Qi; Tong, Honghui; Cui, Xirong; Chu, Paul K.

    2007-04-01

    A broad beam gas ion source based on low-pressure hollow cathode glow discharge is described. An axial magnetic filed produced by AlNiCo permanent magnets enhances the glow discharge in the ion source as a result of the magnetizing electrons between the hollow cathode and rod anode. The gas plasma is produced by magnetron hollow cathode glow discharge in the hollow cathode and a collimated broad ion beam is extracted by a four-grid accelerator system. A weak magnetic field of several millitesla is enough to ignite the magnetron glow discharge at pressure lower than 0.1 Pa, thereby enabling stable and continuous high-current discharge to form the homogeneous plasma. A four-grid accelerator, which separates the extraction and acceleration of the ion beam, is used in this design to generate the high-energy ion beam from 10 keV to 60 keV at a working pressure of 10-4 Torr. Although a higher gas pressure is necessary to maintain the low-pressure glow discharge when compared to hot filament discharge, the hollow cathode ion source is operational with reactive gases such as oxygen in the high-voltage continuous mode. A laterally uniform ion beam can be achieved by using the four-grid accelerator system. The effects of the rod anode length on the characteristics of the plasma discharge as well as ion beam extraction from the ion source are discussed.

  10. Optical Faraday Cup for Heavy Ion Beams

    SciTech Connect

    Bieniosek, Frank; Bieniosek, F.M.; Eylon, S.; Roy, P.K.; Yu, S.S.

    2007-06-25

    We have been using alumina scintillators for imaging beams in heavy-ion beam fusion experiments in 2 to 4 transverse dimensions [1]. The scintillator has a limited lifetime under bombardment by the heavy ion beams. As a possible replacement for the scintillator, we are studying the technique of imaging the beam on a gas cloud. A gas cloud for imaging the beam may be created on a solid hole plate placed in the path of the beam, or by a localized gas jet. It is possible to image the beam using certain fast-quenching optical lines that closely follow beam current density and are independent of gas density. We describe this technique and show preliminary experimental data. This approach has promise to be a new fast beam current diagnostic on a nanosecond time scale.

  11. Focused Ion Beam Technology for Optoelectronic Devices

    NASA Astrophysics Data System (ADS)

    Reithmaier, J. P.; Bach, L.; Forchel, A.

    2003-08-01

    High-resolution proximity free lithography was developed using InP as anorganic resist for ion beam exposure. InP is very sensitive on ion beam irradiation and show a highly nonlinear dose dependence with a contrast function comparable to organic electron beam resists. In combination with implantation induced quantum well intermixing this new lithographic technique based on focused ion beams is used to realize high performance nano patterned optoelectronic devices like complex coupled distributed feedback (DFB) and distributed Bragg reflector (DBR) lasers.

  12. Focused ion beam source method and apparatus

    DOEpatents

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  13. Ion beam sputtering in electric propulsion facilities

    NASA Technical Reports Server (NTRS)

    Sovey, James S.; Patterson, Michael J.

    1991-01-01

    Experiments were undertaken to determine sputter yields of potential ion beam target materials, to assess the impact of charge exchange on beam diagnostics in large facilities, and to examine material erosion and deposition after a 957-hour test of a 5 kW-class ion thruster. The xenon ion sputter yield of flexible graphite was lower than other graphite forms especialy at high angles of incidence. Ion beam charge exchange effects were found to hamper beam probe current collection diagnostics even at pressures from 0.7 to 1.7 mPa. Estimates of the xenon ion beam envelope were made and predictions of the thickness of sputter deposited coatings in the facility were compared with measurements.

  14. Ion beam sputtering in electric propulsion facilities

    NASA Technical Reports Server (NTRS)

    Sovey, James S.; Patterson, Michael J.

    1991-01-01

    Experiments were undertaken to determine sputter yields of potential ion beam target materials, to assess the impact of charge exchange on beam diagnostics in large facilities, and to examine material erosion and deposition after a 957 hr test of a 5 kW-class ion thruster. The xenon ion sputter yield of flexible graphite was lower than other graphite forms especially at high angles of incidence. Ion beam charge exchange effects were found to hamper beam probe current collection diagnostics even at pressures from 0.7 to 1.7 mPa. Estimates of the xenon ion beam envelope were made and predictions of the thickness of sputter deposited coatings in the facility were compared with measurements.

  15. Micrometer-Scale Machining of Metals and Polymers Enabled by Focused Ion Beam Sputtering

    SciTech Connect

    Adams, D.P.; Benavides, G.L.; Vasile, M.J.

    1998-12-22

    This work combines focused ion beam sputtering and ultra-precision machining for microfabrication of metal alloys and polymers. Specifically, micro-end mills are made by Ga ion beam sputtering of a cylindrical tool shank. Using an ion energy of 20keV, the focused beam defines the tool cutting edges that have submicrometer radii of curvature. We demonstrate 25 {micro}m diameter micromilling tools having 2, 4 and 5 cutting edges. These tools fabricate fine channels, 26-28 microns wide, in 6061 aluminum, brass, and polymethyl methacrylate. Micro-tools are structurally robust and operate for more than 5 hours without fracture.

  16. Performance of MBE-4: An experimental multiple beam induction linear accelerator for heavy ions

    SciTech Connect

    Warwick, A.I.; Fessenden, T.J.; Keefe, D.; Kim, C.H.; Meuth, H.

    1988-06-01

    An experimental induction linac, called MBE-4, has been constructed to demonstrate acceleration and current amplification of multiple heavy ion beams. This work is part of a program to study the use of such an accelerator as a driver for heavy ion inertial fusion. MBE-4 is 16m long and accelerates four space-charge-dominated beams of singly-charged cesium ions, in this case from 200 keV to 700 keV, amplifying the current in each beam from 10mA by a factor of nine. Construction of the experiment was completed late in 1987 and we present the results of detailed measurements of the longitudinal beam dynamics. Of particular interest is the contribution of acceleration errors to the growth of current fluctuations and to the longitudinal emittance. The effectiveness of the longitudinal focusing, accomplished by means of the controlled time dependence of the accelerating fields, is also discussed. 4 refs., 5 figs., 1 tab.

  17. Focused ion beam induced deflections of freestanding thin films

    NASA Astrophysics Data System (ADS)

    Kim, Y.-R.; Chen, P.; Aziz, M. J.; Branton, D.; Vlassak, J. J.

    2006-11-01

    Prominent deflections are shown to occur in freestanding silicon nitride thin membranes when exposed to a 50keV gallium focused ion beam for ion doses between 1014 and 1017ions/cm2. Atomic force microscope topographs were used to quantify elevations on the irradiated side and corresponding depressions of comparable magnitude on the back side, thus indicating that what at first appeared to be protrusions are actually the result of membrane deflections. The shape in high-stress silicon nitride is remarkably flat-topped and differs from that in low-stress silicon nitride. Ion beam induced biaxial compressive stress generation, which is a known deformation mechanism for other amorphous materials at higher ion energies, is hypothesized to be the origin of the deflection. A continuum mechanical model based on this assumption convincingly reproduces the profiles for both low-stress and high-stress membranes and provides a family of unusual shapes that can be created by deflection of freestanding thin films under beam irradiation.

  18. Ion beam microtexturing and enhanced surface diffusion

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1982-01-01

    Ion beam interactions with solid surfaces are discussed with particular emphasis on microtexturing induced by the deliberate deposition of controllable amounts of an impurity material onto a solid surface while simultaneously sputtering the surface with an ion beam. Experimental study of the optical properties of microtextured surfaces is described. Measurements of both absorptance as a function of wavelength and emissivity are presented. A computer code is described that models the sputtering and ion reflection processes involved in microtexture formation.

  19. Beam-beam observations in the Relativistic Heavy Ion Collider

    SciTech Connect

    Luo, Y.; Fischer, W.; White, S.

    2015-06-24

    The Relativistic Heavy Ion Collider (RHIC) at Brookhaven National Laboratory has been operating since 2000. Over the past decade, thanks to the continuously increased bunch intensity and reduced β*s at the interaction points, the maximum peak luminosity in the polarized proton operation has been increased by more than two orders of magnitude. In this article, we first present the beam-beam observations in the previous RHIC polarized proton runs. Then we analyze the mechanisms for the beam loss and emittance growth in the presence of beam-beam interaction. The operational challenges and limitations imposed by beam-beam interaction and their remedies are also presented. In the end, we briefly introduce head-on beam-beam compensation with electron lenses in RHIC.

  20. Study of Nanopore Sculpting with Noble Gas Ion Beams at Various Energies

    NASA Astrophysics Data System (ADS)

    Ledden, Bradley; Krueger, Eric; Li, Jiali

    2006-03-01

    We report on experiments using noble gas beams: Helium, Neon, Argon, Krypton, and Xenon, at energies of 1keV, 3keV, and 5keV to controllably fabricate nanopores in freestanding silicon nitride membranes. Utilizing computer simulations (SRIM and TRIM), and a surface adatom diffusion model to describe the phenomenon of nanopore formation, we evaluate the conditions, specifically the ion energy, responsible for highly controllable fabrication of solid state nanopores. Additionally, we present methods to determine the thickness of the grown film as well as the thickness profile of the nanopore.

  1. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, Joshua (Inventor); Hubbell, Theodore E. (Inventor)

    1987-01-01

    A surface of a steel substrate is nitrided without external heating by exposing it to a beam of nitrogen ions under low pressure, a pressure much lower than that employed for ion-nitriding. An ion source is used instead of a glow discharge. Both of these features reduce the introduction of impurities into the substrate surface.

  2. Space charge compensation in the Linac4 low energy beam transport line with negative hydrogen ions

    SciTech Connect

    Valerio-Lizarraga, Cristhian A.; Lallement, Jean-Baptiste; Lettry, Jacques; Scrivens, Richard; Leon-Monzon, Ildefonso; Midttun, Øystein

    2014-02-15

    The space charge effect of low energy, unbunched ion beams can be compensated by the trapping of ions or electrons into the beam potential. This has been studied for the 45 keV negative hydrogen ion beam in the CERN Linac4 Low Energy Beam Transport using the package IBSimu [T. Kalvas et al., Rev. Sci. Instrum. 81, 02B703 (2010)], which allows the space charge calculation of the particle trajectories. The results of the beam simulations will be compared to emittance measurements of an H{sup −} beam at the CERN Linac4 3 MeV test stand, where the injection of hydrogen gas directly into the beam transport region has been used to modify the space charge compensation degree.

  3. Simulation of ion beam transport through the 400 Kv ion implanter at Michigan Ion Beam Laboratory

    SciTech Connect

    Naab, F. U.; Toader, O. F.; Was, G. S.

    2013-04-19

    The Michigan Ion Beam Laboratory houses a 400 kV ion implanter. An application that simulates the ion beam trajectories through the implanter from the ion source to the target was developed using the SIMION Registered-Sign code. The goals were to have a tool to develop an intuitive understanding of abstract physics phenomena and diagnose ion trajectories. Using this application, new implanter users of different fields in science quickly understand how the machine works and quickly learn to operate it. In this article we describe the implanter simulation application and compare the parameters of the implanter components obtained from the simulations with the measured ones. The overall agreement between the simulated and measured values of magnetic fields and electric potentials is {approx}10%.

  4. Intense non-relativistic cesium ion beam

    SciTech Connect

    Lampel, M.C.

    1984-02-01

    The Heavy Ion Fusion group at Lawrence Berkeley Laboratory has constructed the One Ampere Cesium Injector as a proof of principle source to supply an induction linac with a high charge density and high brightness ion beam. This is studied here. An electron beam probe was developed as the major diagnostic tool for characterizing ion beam space charge. Electron beam probe data inversion is accomplished with the EBEAM code and a parametrically adjusted model radial charge distribution. The longitudinal charge distribution was not derived, although it is possible to do so. The radial charge distribution that is derived reveals an unexpected halo of trapped electrons surrounding the ion beam. A charge fluid theory of the effect of finite electron temperature on the focusing of neutralized ion beams (Nucl. Fus. 21, 529 (1981)) is applied to the problem of the Cesium beam final focus at the end of the injector. It is shown that the theory's predictions and assumptions are consistent with the experimental data, and that it accounts for the observed ion beam radius of approx. 5 cm, and the electron halo, including the determination of an electron Debye length of approx. 10 cm.

  5. Laser ion source for low charge heavy ion beams

    SciTech Connect

    Okamura,M.; Pikin, A.; Zajic, V.; Kanesue, T.; Tamura, J.

    2008-08-03

    For heavy ion inertial fusion application, a combination of a laser ion source and direct plasma injection scheme into an RFQ is proposed. The combination might provide more than 100 mA of singly charged heavy ion beam from a single laser shot. A planned feasibility test with moderate current is also discussed.

  6. Experimental study of interactions of highly charged ions with atoms at keV energies

    SciTech Connect

    Kostroun, V.O.

    1992-07-05

    This Progress Report describes the experimental work carried out, and the work in progress, at the Cornell EBIS Laboratory during the period 7/1/1991 to 6/30/1992. During this period, a number of experiments were carried out. The absolute values of the total, one, two and three electron transfer cross sections for highly charged argon ions (8{le}q{le}16) colliding with argon at 2.3 qkev laboratory energy were measured. The distribution of recoil ions and molecular fragments formed in highly charged ion atom and molecule collisions was measured in order to help the interpretation of electron spectra in the 40--320 eV energy range emitted in Ar{sup q+}+Ar(8{le}q{le}16) collisions at 2.3 qkeV that were measured in our laboratory. The interpretation of the electron spectra is still under way. A new collision chamber was built which contains an ion decelerating lens system and a high resolution monochromator-analyzer combination. Ions extracted from the Cornell Electron Beam Ion Source were successfully decelerated from 2.3 qkeV down to 30 qeV Preliminary 0{degree} translational energy spectra for Ar{sup l2+} on Ar at a collision energy of 38.6 qeV show a 0.56 qeV resolution. Work is in progress to extend measurements of cross sections and recoil ion charge state distributions down to collision energies in the 10 eV/amu range.

  7. A Distributed Radiator, Heavy Ion Target with Realistic Ion Beams

    NASA Astrophysics Data System (ADS)

    Callahan, Debra A.; Tabak, Max

    1997-11-01

    Recent efforts in heavy ion target design have centered around the distributed radiator design of Tabak(M. Tabak, Bull. Am. Phys. Soc., Vol 41, No 7, 1996.). The initial distributed radiator target assumed beams with a uniform radial density distribution aimed directly along the z axis. Chamber propagation simulations indicate that the beam distribution is more nearly Gaussian at best focus. In addition, more than two beams will be necessary to carry the required current; this means that the beams must be angled to allow space for the final focusing systems upstream. We will describe our modifications to the distributed radiator target to allow realistic beams and realistic beam angles.

  8. First test of BNL electron beam ion source with high current density electron beam

    SciTech Connect

    Pikin, Alexander Alessi, James G. Beebe, Edward N.; Shornikov, Andrey; Mertzig, Robert; Wenander, Fredrik; Scrivens, Richard

    2015-01-09

    A new electron gun with electrostatic compression has been installed at the Electron Beam Ion Source (EBIS) Test Stand at BNL. This is a collaborative effort by BNL and CERN teams with a common goal to study an EBIS with electron beam current up to 10 A, current density up to 10,000 A/cm{sup 2} and energy more than 50 keV. Intensive and pure beams of heavy highly charged ions with mass-to-charge ratio < 4.5 are requested by many heavy ion research facilities including NASA Space Radiation Laboratory (NSRL) at BNL and HIE-ISOLDE at CERN. With a multiampere electron gun, the EBIS should be capable of delivering highly charged ions for both RHIC facility applications at BNL and for ISOLDE experiments at CERN. Details of the electron gun simulations and design, and the Test EBIS electrostatic and magnetostatic structures with the new electron gun are presented. The experimental results of the electron beam transmission are given.

  9. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, Donald J.

    1988-01-01

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  10. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, D.J.

    1986-03-25

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  11. Substrate heating measurements in pulsed ion beam film deposition

    SciTech Connect

    Olson, J.C.; Davis, H.A.; Rej, D.J.; Waganaar, W.J.; Tallant, D.R.; Thompson, M.O.

    1995-05-01

    Diamond-like Carbon (DLC) films have been deposited at Los Alamos National Laboratory by pulsed ion beam ablation of graphite targets. The targets were illuminated by an intense beam of hydrogen, carbon, and oxygen ions at a fluence of 15-45 J/cm{sup 2}. Ion energies were on the order of 350 keV, with beam current rising to 35 kA over a 400 ns ion current pulse. Raman spectra of the deposited films indicate an increasing ratio of sp{sup 3} to sp{sup 2} bonding as the substrate is moved further away from the target and further off the target normal. Using a thin film platinum resistor at varying positions, we have measured the heating of the substrate surface due to the kinetic energy and heat of condensation of the ablated material. This information is used to determine if substrate heating is responsible for the lack of DLC in positions close to the target and near the target normal. Latest data and analysis will be presented.

  12. O+ ion beams reflected below the Martian bow shock: MAVEN observations

    NASA Astrophysics Data System (ADS)

    Masunaga, K.; Seki, K.; Brain, D. A.; Fang, X.; Dong, Y.; Jakosky, B. M.; McFadden, J. P.; Halekas, J. S.; Connerney, J. E. P.

    2016-04-01

    We investigate a generation mechanism of O+ ion beams observed above the Martian bow shock by analyzing ion velocity distribution functions (VDFs) measured by the Suprathermal and Thermal Ion Composition instrument on the Mars Atmosphere and Volatile Evolution (MAVEN) spacecraft. In the solar wind near Mars, MAVEN often observes energetic O+ ion beams (~10 keV or higher). Accompanied with the O+ ion beam events, we sometimes observe characteristic ion VDFs in the magnetosheath: a partial ring distribution. The partial ring distribution corresponds to pickup ions with a finite initial velocity (i.e., not newborn pickup ions), and its phase space density is much smaller than that of local pickup O+ ions of the magnetosheath. Thus, the partial ring distribution is most likely produced by the reflection of pickup O+ ions precipitating from the upstream solar wind below the bow shock. After being injected into the magnetosheath from the solar wind, the precipitating O+ ions are subject to the significantly enhanced magnetic field in this region and start to gyrate around the guiding center of the plasma frame in the magnetosheath. Consequently, a part of precipitating O+ ions are reflected back to the solar wind, generating O+ beams in the solar wind. The beams direct quasi-sunward near the subsolar region but have large angle with respect to the sunward direction at high solar zenith angles (>50°). The reflected O+ beams are accelerated by the convection electric field of the solar wind and may escape Mars.

  13. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Babbush, C. A.; Vankampen, C. L.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic pros-thesis fixtion, and dental implants.

  14. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Van Kampen, C. L.; Babbush, C. A.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic prosthesis fixation, and dental implants.

  15. Ion-beam technology and applications

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.; Robson, R. R.; Sovey, J. S.

    1977-01-01

    Ion propulsion research and development yields a mature technology that is transferable to a wide range of nonpropulsive applications, including terrestrial and space manufacturing. A xenon ion source was used for an investigation into potential ion-beam applications. The results of cathode tests and discharge-chamber experiments are presented. A series of experiments encompassing a wide range of potential applications is discussed. Two types of processes, sputter deposition, and erosion were studied. Some of the potential applications are thin-film Teflon capacitor fabrication, lubrication applications, ion-beam cleaning and polishing, and surface texturing.

  16. Novel method for unambiguous ion identification in mixed ion beams extracted from an electron beam ion trap

    SciTech Connect

    Meissl, W.; Simon, M. C.; Crespo Lopez-Urrutia, J. R.; Tawara, H.; Ullrich, J.; Winter, HP.; Aumayr, F.

    2006-09-15

    A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an electron beam ion trap is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio.

  17. Effect of the electrostatic plasma lens on the emittance of ahigh-current heavy ion beam

    SciTech Connect

    Chekh, Yu.; Goncharov, A.; Protsenko, I.; Brown, I.G.

    2004-01-10

    We describe measurements we have made of the emittance of a high-current, moderate-energy ion beam after transport through a permanent-magnet electrostatic plasma lens. The results indicate the absence of emittance growth due to the lens, when the lens is adjusted for optimal beam focusing. The measured emittance for a 16 keV Cu{sup 2+} ion beam formed by a vacuum arc ion source was about 0.4 {pi} {center_dot} mm {center_dot} mrad at a beam current of 50 mA rising more-or-less linearly to 1.5 {pi} {center_dot} mm {center_dot} mrad at 250 mA, and was conserved in beam transport through the lens. These results have significance for the application of high-current ion sources and the electrostatic plasma lens to particle accelerator injection.

  18. ION BEAM ETCHING EFFECTS IN BIOLOGICAL MICROANALYSIS

    EPA Science Inventory

    Oxygen ion beam sputter etching used in SIMS has been shown to produce morphologic effects which have similarities and differences in comparison to rf plasma etching of biological specimens. Sputter yield variations resulting from structural microheterogeneity are illustrated (e....

  19. Biomedical applications of ion-beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Gibbons, D. F.; Vankampen, C. L.; Babbush, C. A.

    1979-01-01

    Microscopically-rough surface texture of various biocompatible alloys and polymers produced by ion-beam sputtering may result in improvements in response of hard or soft tissue to various surgical implants.

  20. Adhesion enhancement of ion beam mixed Cu/Al/polyimide

    NASA Astrophysics Data System (ADS)

    Chang, G. S.; Jung, S. M.; Lee, Y. S.; Choi, I. S.; Whang, C. N.; Woo, J. J.; Lee, Y. P.

    1997-01-01

    Cu (400 Å)/polyimide was mixed with 80 keV Ar+ and N2+ from 1.0×1015 to 2.0×1016 ions/cm2. The same processes were repeated for the Cu (400 Å)/Al (50 Å)/polyimide system which has Al as a buffer layer. The quantitative adhesion strength was measured by a standard scratch test. X-ray photoelectron spectroscopy was employed to investigate the change in the chemical bonds of the ion beam mixed polyimide substrate and the intermediate effects for the adhesion enhancement in Cu/Al/polyimide. Two distinct tendencies are observed in the adhesion strength: Cu/Al/polyimide is more adhesive than Cu/polyimide after ion beam mixing, and N2+ ions are more effective in the adhesion enhancement than Ar+. The formation of an interlayer compound of CuAl2O4 accounts for the former, while the latter is understood by the fact that N2+ ions produce more pyridinelike moiety, amide group and tertiary amine moiety which are known as adhesion promoters.

  1. Ion Beam Scattering by Background Helium

    NASA Astrophysics Data System (ADS)

    Grillet, Anne; Hughes, Thomas; Boerner, Jeremiah

    2015-11-01

    The presence of background gases can cause charged particle beams to become more diffuse due to scattering. Calculations for the transport of an ion beam have been performed using Aleph, a particle-in-cell plasma modeling code, and verified against a general envelop equation for charged particle beams. We have investigated the influence of background helium on the coherence and transmitted current of the ion beam. Collisions between ions and neutral particles were calculated assuming isotropic elastic scattering. Since this tends to predict larger scattering angles than are expected at high energies, these are conservative estimates for beam scattering. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration.

  2. Beam dynamics in heavy ion induction LINACS

    SciTech Connect

    Smith, L.

    1981-10-01

    Interest in the use of an induction linac to accelerate heavy ions for the purpose of providing the energy required to initiate an inertially confined fusion reaction has stimulated a theoretical effort to investigate various beam dynamical effects associated with high intensity heavy ion beams. This paper presents a summary of the work that has been done so far; transverse, longitudinal and coupled longitudinal transverse effects are discussed.

  3. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1985-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  4. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1984-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  5. Ion beam processing of advanced electronic materials

    SciTech Connect

    Cheung, N.W.; Marwick, A.D.; Roberto, J.B.; International Business Machines Corp., Yorktown Heights, NY . Thomas J. Watson Research Center; Oak Ridge National Lab., TN )

    1989-01-01

    This report contains research programs discussed at the materials research society symposia on ion beam processing of advanced electronic materials. Major topics include: shallow implantation and solid-phase epitaxy; damage effects; focused ion beams; MeV implantation; high-dose implantation; implantation in III-V materials and multilayers; and implantation in electronic materials. Individual projects are processed separately for the data bases. (CBS)

  6. Ion beam mixing of Fe with sapphire and silica

    SciTech Connect

    Sinha, S. K.; Vigen, K. M.; Kothari, D. C.; Som, T.; Kulkarni, V. N.; Nair, K. G. M.

    1999-06-10

    We have studied ion beam mixing of Fe with sapphire, silica, Al and Si using different mass of the ions (Ne{sup +},Ar{sup +}), different doses (5x10{sup 15} to 2x10{sup 17} ions/cm{sup 2}) and different temperatures (273 deg. K, 423 deg. K and 573 deg. K). Thin film of Fe was deposited by thermal evaporation method. Ion energy was chosen from 30 to 110 keV so that F{sub d} is maximum at the interface. All the specimens were analyzed by RBS. It is found that the square of the diffusion length Dt is proportional to the ion dose for both types of the substrates (Al{sub 2}O{sub 3} and SiO{sub 2}) implying that mixing is due to the ballistic effect (i.e. cascade mixing). Also mixing is more when irradiated by Ar{sup +} ions than Ne{sup +} ions. Comparison of Dt's shows that mixing is less in ceramics than in pure-elements Al and Si. In Fe-Al{sub 2}O{sub 3} samples, mixing decreases with increase in irradiation temperatures implying de-mixing in crystalline ionic bonded oxide whereas mixing increases in the covalently bonded oxide SiO{sub 2}. Irradiated annealed samples of Fe/Al{sub 2}O{sub 3} and Fe/SiO{sub 2} show de-mixing and mixing respectively.

  7. Evaluation of collagen immobilized to silicon plates by ion beam

    NASA Astrophysics Data System (ADS)

    Yokoyama, Y.; Kobayashi, T.; Iwaki, M.

    2006-01-01

    A study has been made of immobilization of collagen coated on the substrate by ion beam in order to elucidate the effects of ion bombardment on cell adhesion strength. Substrates used were silicon plates, on which 0.3% type-I collagen solution was coated using a spin coater. The collagen-coated silicon was bombarded with 50 keV He+ ions at doses from 1 × 1013 to 1 × 1015 ions/cm2 using a RIKEN TK-100 ion implanter. The collagen-immobilized specimens were mounted on a parallel-plate flow chamber to perform the collagen adhesion tests with a flowing shear stress. Morphological observations of collagen were performed by scanning transmission electron microscopy (STEM). The chemical condition of collagen was detected by X-ray photoelectron spectroscopy (XPS). The collagen layer in the non-bombarded specimen was about 20 nm in thickness. STEM micrographs showed that collagen layer has thinned due to contraction by ion bombardment as the dose increased. After the collagen adhesion test, collagen layer surface with the non-bombarded specimen was peeled off by shear stress. As the dose increased, the detachment of collagen was suppressed. Detachment of collagen was hardly observed for the dose of 1 × 1015 ions/cm2. The XPS results of collagen structures showed that ion bombardment generated new bonds between collagen molecules in the collagen layer. It is concluded that the increase of collagen adhesion at higher doses is due to the ion-beam immobilization of collagen molecules resulting from new bond generation by displaced atoms and excited atoms between collagen molecules in the collagen layer.

  8. Superintense ion beam with high energy density

    NASA Astrophysics Data System (ADS)

    Dudnikov, Vadim; Dudnikova, Galina

    2008-04-01

    The energy density of ion beam accumulated in a storage ring can be increased dramatically with using of space charge compensation as was demonstrated in experiments [1]. The intensity of said superintense beam can be far greater than a space charge limit without space charge compensation. The model of secondary plasma build up with secondary ion-electron emission as a source of delayed electrons has been presented and discussed. This model can be used for explanation of bunched beam instability with electron surviving after gap, for prediction of e-cloud generation in coasting and long bunches beam, and can be important for pressure rise in worm and cold sections of storage rings. A fast desorption by ion of physically adsorbed molecules can explain a ``first pulse Instability''. Application of this model for e-p instability selfstabilization and superintense circulating beam accumulation is considered. Importance of secondary plasma for high perveance ion beam stabilization in ion implantation will be considered. Preliminary results of simulation of electron and ion accumulation will be presented. [1]. Belchenko et al., Xth International Particle Accelerator Conference, Protvino, 1977, Vol. 2, p. 287.

  9. A bent electrostatic ion beam trap for simultaneous measurements of fragmentation and ionization of cluster ions.

    PubMed

    Aviv, O; Toker, Y; Errit, M; Bhushan, K G; Pedersen, H B; Rappaport, M L; Heber, O; Schwalm, D; Zajfman, D

    2008-08-01

    We describe a bent electrostatic ion beam trap in which cluster ions of several keV kinetic energy can be stored on a V-shaped trajectory by means of an electrostatic deflector placed between two electrostatic mirrors. While maintaining all the advantages of its linear counterpart [Zajfman et al., Phys. Rev. A 55, R1577 (1997); Dahan et al., Rev. Sci. Instrum. 69, 76 (1998)], such as long storage times, straight segments, and a field-free region for merged or crossed beam experiments, the bent trap allows for simultaneous measurement of charged and neutral fragments and determination of the average kinetic energy released in the fragmentation. These unique properties of the bent trap are illustrated by first results concerning the competition between delayed fragmentation and ionization of Al(n) (-) clusters after irradiation by a short laser pulse. PMID:19044339

  10. Monte Carlo modeling of ion beam induced secondary electrons.

    PubMed

    Huh, U; Cho, W; Joy, D C

    2016-09-01

    Ion induced secondary electrons (iSE) can produce high-resolution images ranging from a few eV to 100keV over a wide range of materials. The interpretation of such images requires knowledge of the secondary electron yields (iSE δ) for each of the elements and materials present and as a function of the incident beam energy. Experimental data for helium ions are currently limited to 40 elements and six compounds while other ions are not well represented. To overcome this limitation, we propose a simple procedure based on the comprehensive work of Berger et al. Here we show that between the energy range of 10-100keV the Berger et al. data for elements and compounds can be accurately represented by a single universal curve. The agreement between the limited experimental data that is available and the predictive model is good, and has been found to provide reliable yield data for a wide range of elements and compounds. PMID:27337603

  11. A pencil beam algorithm for helium ion beam therapy

    SciTech Connect

    Fuchs, Hermann; Stroebele, Julia; Schreiner, Thomas; Hirtl, Albert; Georg, Dietmar

    2012-11-15

    Purpose: To develop a flexible pencil beam algorithm for helium ion beam therapy. Dose distributions were calculated using the newly developed pencil beam algorithm and validated using Monte Carlo (MC) methods. Methods: The algorithm was based on the established theory of fluence weighted elemental pencil beam (PB) kernels. Using a new real-time splitting approach, a minimization routine selects the optimal shape for each sub-beam. Dose depositions along the beam path were determined using a look-up table (LUT). Data for LUT generation were derived from MC simulations in water using GATE 6.1. For materials other than water, dose depositions were calculated by the algorithm using water-equivalent depth scaling. Lateral beam spreading caused by multiple scattering has been accounted for by implementing a non-local scattering formula developed by Gottschalk. A new nuclear correction was modelled using a Voigt function and implemented by a LUT approach. Validation simulations have been performed using a phantom filled with homogeneous materials or heterogeneous slabs of up to 3 cm. The beams were incident perpendicular to the phantoms surface with initial particle energies ranging from 50 to 250 MeV/A with a total number of 10{sup 7} ions per beam. For comparison a special evaluation software was developed calculating the gamma indices for dose distributions. Results: In homogeneous phantoms, maximum range deviations between PB and MC of less than 1.1% and differences in the width of the distal energy falloff of the Bragg-Peak from 80% to 20% of less than 0.1 mm were found. Heterogeneous phantoms using layered slabs satisfied a {gamma}-index criterion of 2%/2mm of the local value except for some single voxels. For more complex phantoms using laterally arranged bone-air slabs, the {gamma}-index criterion was exceeded in some areas giving a maximum {gamma}-index of 1.75 and 4.9% of the voxels showed {gamma}-index values larger than one. The calculation precision of the

  12. A synchronous beam sweeper for heavy ions

    SciTech Connect

    Bogaty, J.M.

    1989-01-01

    The Argonne Tandem Linac Accelerator System (ATLAS) facility at Argonne National Laboratory provides a wide range of accelerated heavy ions from the periodic table. Frequently, the beam delivery rate of 12 MHz is too fast for the type of experiment on line. Reaction by-products from a target bombardment may have a decay interval much longer than the dead time between beam bunches. To prevent data from being corrupted by incoming ions a beam sweeper was developed which synchronously eliminates selected beam bunches to suit experimental needs. As the SWEEPER is broad band (DC to 6 MHz) beam delivery rates can be instantaneously changed. Ion beam bunches are selectively kicked out by an electrostatic dipole electrode pulsed to 2 kVDC. The system has been used for almost three years with several hundred hours of operating time logged to date. Beam bunch delivery rates of 6 MHz down to 25 kHz have been provided. Since this is a non-resonant system any beam delivery rate from 6 MHz down to zero can be set. In addition, burst modes have been used where beam is supplied in 12 MHz bursts and then shut down for a period of time set by the user. 3 figs.

  13. Diagnostics of ion beam generated from a Mather type plasma focus device

    SciTech Connect

    Lim, L. K. Ngoi, S. K. Wong, C. S. Yap, S. L.

    2014-03-05

    Diagnostics of ion beam emission from a 3 kJ Mather-type plasma focus device have been performed for deuterium discharge at low pressure regime. Deuterium plasma focus was found to be optimum at pressure of 0.2 mbar. The energy spectrum and total number of ions per shot from the pulsed ion beam are determined by using biased ion collectors, Faraday cup, and solid state nuclear track detector CR-39. Average energy of the ion beam obtained is about 60 keV. Total number of the ions has been determined to be in the order of 10{sup 11} per shot. Solid state nuclear track detectors (SSNTD) CR39 are employed to measure the particles at all angular direction from end on (0°) to side on (90°). Particle tracks are registered by SSNTD at 30° to 90°, except the one at the end-on 0°.

  14. Thermoacoustic imaging using heavy ion beams

    SciTech Connect

    Claytor, T.N.; Tesmer, J.R.; Deemer, B.C.; Murphy, J.C.

    1995-10-01

    Ion beams have been used for surface modification, semiconductor device fabrication and for material analysis, which makes ion-material interactions of significant importance. Ion implantation will produce new compositions near the surface by ion mixing or directly by implanting desired ions. Ions exchange their energy to the host material as they travel into the material by several different processes. High energy ions ionize the host atoms before atomic collisions transfer the remaining momentum and stop the incident ion. As they penetrate the surface, the low energy ions ionize the host atoms, but also have a significantly large momentum transfer mechanism near the surface of the material. This leads to atoms, groups of atoms and electrons being ejected from the surface, which is the momentum transfer process of sputtering. This talk addresses the acoustic waves generated during ion implantation using modulated heavy ion beams. The mechanisms for elastic wave generation during ion implantation, in the regimes where sputtering is significant and where implantation is dominant and sputtering is negligible, has been studied. The role of momentum transfer and thermal energy production during ion implantation was compared to laser generated elastic waves in an opaque solid as a reference, since laser generated ultrasound has been extensively studied and is fairly well understood. The thermoelastic response dominated in both high and low ion energy regimes since, apparently, more energy is lost to thermal heat producing mechanisms than momentum transfer processes. The signal magnitude was found to vary almost linearly with incident energy as in the laser thermoelastic regime. The time delays for longitudinal and shear waves-were characteristic of those expected for a purely thermal heating source. The ion beams are intrinsically less sensitive to the albedo of the surface.

  15. Graphene engineering by neon ion beams

    DOE PAGESBeta

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphenemore » based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.« less

  16. Beam current controller for laser ion source

    SciTech Connect

    Okamura, Masahiro

    2014-10-28

    The present invention relates to the design and use of an ion source with a rapid beam current controller for experimental and medicinal purposes. More particularly, the present invention relates to the design and use of a laser ion source with a magnetic field applied to confine a plasma flux caused by laser ablation.

  17. Progress toward a microsecond duration, repetitive, intense-ion beam for active spectroscopic measurements on ITER

    SciTech Connect

    Davis, H.A.; Bartsch, R.R.; Barnes, C.W.

    1996-06-01

    The authors describe the design of an intense, pulsed, repetitive, neutral beam based on magnetically insulated diode technology for injection into ITER for spectroscopic measurements of thermalizing alpha particle and thermal helium density profiles, ion temperature, plasma rotation, and low Z impurity concentrations in the confinement region. The beam is being developed to enhance low signal-to-noise ratios expected with conventional steady-state ion beams because of severe beam attenuation and intense bremstrahlung emission. A 5 GW (e.g., 100 keV, 50 kA) one-microsecond-duration beam would increase the signal by 10{sup 3} compared to a conventional 5 MW beam with signal-to-noise ratios comparable to those from a chopped conventional beam in one second.

  18. Beam Diagnostics for Measurements of In-Flight Annihilation Cross Sections of Antiprotons at 130 keV

    NASA Astrophysics Data System (ADS)

    Aghai-Khozani, Hossein; Barna, Daniel; Corradini, Maurizio; Hayano, Ryugo; Hori, Masaki; Kobayashi, Takumi; Leali, Marco; Lodi-Rizzini, Evandro; Mascagna, Valerio; Prest, Michela; Soter, Anna; Todoroki, Koichi; Vallazza, Erik; Venturelli, Luca; Zurlo, Nicola

    The ASACUSA (the Atomic Spectroscopy And Collisions Using Slow Antiprotons) collaboration of CERN is currently attempting to measure the antiproton-nucleus in-flight annihilation cross sections on thin target foils of C, Pd, and Pt at the kinetic energy of 130 keV. The low-energy antiprotons were provided by the Antiproton Decelerator of CERN and a radio-frequency quadrupole decelerator developed by the ASACUSA collaboration. A beam profile monitor based on secondary electron emission was developed for this measurement. It was used to measure the spatial profile of 200-ns-long beam pulses containing 105-106 antiprotons with an active area of 40 mm × 40 mm and a spatial resolution of 4 mm. Using this monitor, we succeeded in finely tuning antiproton beams to an 80-mm-diameter target, and observed some annihilation events originating from the target.

  19. Mass spectrometer and methods of increasing dispersion between ion beams

    DOEpatents

    Appelhans, Anthony D.; Olson, John E.; Delmore, James E.

    2006-01-10

    A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sector being used as a dispersive element following magnetic separation of the plurality of ion beams. Other apparatus and methods are provided.

  20. Energy loss of keV fluorine ions scattered off a missing-row reconstructed Au(110) surface under grazing incidence

    SciTech Connect

    Chen, L.; Shen, J.; Esaulov, V. A.; Valdes, J. E.; Vargas, P.

    2011-03-15

    A joint experimental and theoretical study of energy loss is presented for 1-to-4-keV fluorine negative ions in grazing scattering on a missing-row reconstructed Au(110) surface. Measurements of energy losses for various azimuthal orientations of the crystal have been performed by means of a time-of-flight method with a pulsed beam. The dependence of the fraction of surviving negative ions on azimuthal angles, was determined. Our energy-loss data are discussed in light of trajectory and stopping-power calculations, where the explicit inclusion of the nonuniform electron density at the surface provides good agreement with the experimental data. The simulation allows us to delineate various trajectory classes that correspond to different contributions in the energy-loss spectra for various azimuthal orientations of the surface.

  1. The role of space charge compensation for ion beam extraction and ion beam transport (invited)

    SciTech Connect

    Spädtke, Peter

    2014-02-15

    Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation.

  2. Upgoing ion beams. I - Microscopic analysis

    NASA Astrophysics Data System (ADS)

    Kaufmann, R. L.; Kintner, P. M.

    1982-12-01

    The stability of electrostatic waves with frequencies near the hydrogen cyclotron frequency is investigated for an auroral plasma containing an ion beam by studying the relationship between low-frequency waves (0-1 kHz) and particles seen by the S3-3 satellite. It is concluded that only electrostatic hydrogen ion cyclotron (EHC) waves can be generated at the observed frequencies by the observed energetic particles, with the waves being produced either by drifting electrons or by the ion beam. In the model developed, ion beams are seen with their observed temperatures because they have evolved to a weakly unstable configuration in which the wave growth length is comparable to the width of the beam region. Waves are well confined to the beams because they are damped rapidly in the adjacent plasma, and the mirror effect can maintain a weak instability over a considerable altitude range. It is proposed that this effect is a source for strong pitch angle scattering, as well as an explanation for the nonexistence of downgoing ion beams.

  3. Ion sources and targets for radioactive beams

    SciTech Connect

    Schiffer, J.P.; Back, B.B.; Ahmad, I.

    1995-08-01

    A high-intensity ISOL-type radioactive beam facility depends critically on the performance of the target/ion source system. We developed a concept for producing high-intensity secondary beams of fission fragments, such as {sup 132}Sn, using a two-part target and ion source combination. The idea involves stopping a 1000-kW beam of 200-MeV deuterons in a target of Be or U to produce a secondary beam of neutrons. Just behind the neutron production target is a second target, typically a porous form of UC, coupled to an ISOL-type ion source. In December 1994, we tested this concept with 200-MeV deuterons at low intensity in an experiment at the NSCL. The yields of characteristic gamma rays were measured and confirmed our predictions.

  4. Laser-cooled continuous ion beams

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    A collaboration with a group in Arhus, Denmark, using their storage ring ASTRID, brought about better understanding of ion beams cooled to very low temperatures. The longitudinal Schottky fluctuation noise signals from a cooled beam were studied. The fluctuation signals are distorted by the effects of space charge as was observed in earlier measurements at other facilities. However, the signal also exhibits previously unobserved coherent components. The ions` velocity distribution, measured by a laser fluorescence technique suggests that the coherence is due to suppression of Landau damping. The observed behavior has important implications for the eventual attainment of a crystalline ion beam in a storage ring. A significant issue is the transverse temperature of the beam -- where no direct diagnostics are available and where molecular dynamics simulations raise interesting questions about equilibrium.

  5. Precise formation of geometrically focused ion beams

    SciTech Connect

    Davydenko, V.I.; Ivanov, A.A.; Korepanov, S.A.; Kotelnikov, I.A.

    2006-03-15

    Geometrically focused intense neutral beams for plasma diagnostic consist of many elementary beams formed by a multiaperture ion-optical system and aimed at the focal point. In real conditions, some of the elementary beams may have increased angular divergence and/or deviate from the intended direction, thus diminishing the neutral beam density at the focus. Several improvements to the geometrical focusing are considered in the article including flattening of the plasma profile across the emission surface, using of quasi-Pierce electrodes at the beam periphery, and minimizing the deviation of the electrodes from the spherical form. Application of these measures to the neutral beam Russian diagnostic injector developed in Budker Institute of Nuclear Physics allows an increase of neutral beam current density in the focus by {approx}50%.

  6. Optical studies of ion-beam synthesized metal alloy nanoparticles

    SciTech Connect

    Magudapathy, P. Srivatsava, S. K.; Gangopadhyay, P.; Amirthapandian, S.; Sairam, T. N.; Panigrahi, B. K.

    2015-06-24

    Au{sub x}Ag{sub 1-x} alloy nanoparticles with tunable surface plasmon resonance (SPR) have been synthesized on a silica glass substrate. A small Au foil on an Ag foil is irradiated as target substrates such that ion beam falls on both Ag foil and Au foils. Silica slides are kept at an angle ∼45° with respect to the metallic foils. While irradiating the metallic foils with 100 keV Ar{sup +} ions, sputtered Au and Ag atoms get deposited on the silica-glass. In this configuration the foils have been irradiated by Ar{sup +} ions to various fluences at room temperature and the sputtered species are collected on silica slides. Formation of Au{sub x}Ag{sub 1-x} nanoparticles has been confirmed from the optical absorption measurements. With respect to the exposure area of Au and Ag foils to the ion beam, the SPR peak position varies from 450 to 500 nm. Green photoluminescence has been observed from these alloy metal nanoparticles.

  7. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera.

    PubMed

    Baumann, Thomas M; Lapierre, Alain; Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-01

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r(80%) = (212 ± 19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm(2) is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments. PMID:25085129

  8. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

    SciTech Connect

    Baumann, Thomas M. Lapierre, Alain Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-15

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r{sub 80%}=(212±19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm{sup 2} is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.

  9. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

    NASA Astrophysics Data System (ADS)

    Baumann, Thomas M.; Lapierre, Alain; Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-01

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r_{80%}=(212± 19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm2 is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.

  10. Ion beams from laser-generated plasmas

    NASA Technical Reports Server (NTRS)

    Hughes, R. H.; Anderson, R. J.; Gray, L. G.; Rosenfeld, J. P.; Manka, C. K.; Carruth, M. R.

    1980-01-01

    The paper describes the space-charge-limited beams produced by the plasma blowoffs generated by 20-MW bursts of 1.06-micron radiation from an active Q-switched Nd:YAG laser. Laser power densities near 10 to the 11th/sq cm on solid targets generate thermalized plasma plumes which drift to a 15-kV gridded extraction gap where the ions are extracted, accelerated, and electrostatically focused; the spatially defined ion beams are then magnetically analyzed to determine the charge state content in the beams formed from carbon, aluminum, copper, and lead targets. This technique preserves time-of-flight (TOF) information in the plasma drift region, which permits plasma ion temperatures and mass flow velocities to be determined from the Maxwellian ion curve TOF shapes for the individual charge species.

  11. Ion beam driven warm dense matter experiments

    NASA Astrophysics Data System (ADS)

    Bieniosek, F. M.; Ni, P. A.; Leitner, M.; Roy, P. K.; More, R.; Barnard, J. J.; Kireeff Covo, M.; Molvik, A. W.; Yoneda, H.

    2007-11-01

    We report plans and experimental results in ion beam-driven warm dense matter (WDM) experiments. Initial experiments at LBNL are at 0.3-1 MeV K+ beam (below the Bragg peak), increasing toward the Bragg peak in future versions of the accelerator. The WDM conditions are envisioned to be achieved by combined longitudinal and transverse neutralized drift compression to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. Initial experiments include an experiment to study transient darkening at LBNL; and a porous target experiment at GSI heated by intense heavy-ion beams from the SIS 18 storage ring. Further experiments will explore target temperature and other properties such as electrical conductivity to investigate phase transitions and the critical point.

  12. EXTRACTION COMPRESSION AND ACCELERATION OF HIGH LINE CHARGE DENSITY ION BEAMS

    SciTech Connect

    Henestroza, Enrique; Henestroza, E.; Peters, C.; Yu, S.S.; Grote, D.P.; Briggs, R.J.

    2005-05-20

    High Energy Density Physics (HEDP) applications require high line charge density ion beams. An efficient method to obtain this type of beams is to extract a long pulse, high current beam from a gun at high energy, and let the beam pass through a decelerating field to compress it. The low energy beam-bunch is loaded into a solenoid and matched to a Brillouin flow. The Brillouin equilibrium is independent of the energy if the relationship between the beam size (a), solenoid magnetic field strength (B) and line charge density is such that (Ba){sup 2} is proportional to the line charge density. Thus it is possible to accelerate a matched beam at constant line charge density. An experiment, NDCX-1c is being designed to test the feasibility of this type of injectors, where we will extract a 1 microsecond, 100 mA, potassium beam at 160 keV, decelerate it to 55 keV (density {approx}0.2 {micro}C/m), and load it into a 2.5 T solenoid where it will be accelerated to 100-150 keV (head to tail) at constant line charge density. The head-to-tail velocity tilt can be used to increase bunch compression and to control longitudinal beam expansion. We will present the physics design and numerical simulations of the proposed experiment.

  13. High current ion beam transport using solenoids

    SciTech Connect

    Hollinger, R.; Spaedtke, P.

    2008-02-15

    In the framework of the future project FAIR several upgrade programs and construction of new facilities are in progress such as the U{sup 4+} upgrade for the existing high current injector and the new 70 MeV proton injector. For both injectors solenoids in the low energy beam transport section are foreseen to inject the beam into the following rf accelerator. The paper presents beam quality measurements of high current ion beams behind a solenoid using a slit-grid emittance measurement device, viewing targets, and a pepper pot measurement device at the high current test bench at GSI.

  14. Electron Cooling of Intense Ion Beam

    SciTech Connect

    Dietrich, J.; Kamerdjiev, V.; Maier, R.; Prasuhn, D.; Stein, J.; Stockhorst, H.; Korotaev, Yu.; Meshkov, I.; Sidorin, A.; Smirnov, A.

    2006-03-20

    Results of experimental studies of the electron cooling of a proton beam at COSY (Juelich, Germany) are presented. Intensity of the proton beam is limited by two general effects: particle loss directly after the injection and development of instability in a deep cooled ion beam. Results of the instability investigations performed at COSY during last years are presented in this report in comparison with previous results from HIMAC (Chiba, Japan) CELSIUS (Uppsala, Sweden) and LEAR (CERN). Methods of the instability suppression, which allow increasing the cooled beam intensity, are described. This work is supported by RFBR grant no. 05-02-16320 and INTAS grant no. 03-54-5584.

  15. Long-pulse beam acceleration of MeV-class H(-) ion beams for ITER NB accelerator.

    PubMed

    Umeda, N; Kashiwagi, M; Taniguchi, M; Tobari, H; Watanabe, K; Dairaku, M; Yamanaka, H; Inoue, T; Kojima, A; Hanada, M

    2014-02-01

    In order to realize neutral beam systems in International Thermonuclear Experimental Reactor whose target is to produce a 1 MeV, 200 A/m(2) during 3600 s D(-) ion beam, the electrostatic five-stages negative ion accelerator so-called "MeV accelerator" has been developed at Japan Atomic Energy Agency. To extend pulse length, heat load of the acceleration grids was reduced by controlling the ion beam trajectory. Namely, the beam deflection due to the residual magnetic field of filter magnet was suppressed with the newly developed extractor with a 0.5 mm off-set aperture displacement. The new extractor improved the deflection angle from 6 mrad to 1 mrad, resulting in the reduction of direct interception of negative ions from 23% to 15% of the total acceleration power, respectively. As a result, the pulse length of 130 A/m(2), 881 keV H(-) ion beam has been successfully extended from a previous value of 0.4 s to 8.7 s. This is the first long pulse negative ion beam acceleration over 100 MW/m(2). PMID:24593581

  16. Status report on the development of a tubular electron beam ion source

    NASA Astrophysics Data System (ADS)

    Donets, E. D.; Donets, E. E.; Becker, R.; Liljeby, L.; Rensfelt, K.-G.; Beebe, E. N.; Pikin, A. I.

    2004-05-01

    The theoretical estimations and numerical simulations of tubular electron beams in both beam and reflex mode of source operation as well as the off-axis ion extraction from a tubular electron beam ion source (TEBIS) are presented. Numerical simulations have been done with the use of the IGUN and OPERA-3D codes. Numerical simulations with IGUN code show that the effective electron current can reach more than 100 A with a beam current density of about 300-400 A/cm2 and the electron energy in the region of several KeV with a corresponding increase of the ion output. Off-axis ion extraction from the TEBIS, being the nonaxially symmetric problem, was simulated with OPERA-3D (SCALA) code. The conceptual design and main parameters of new tubular sources which are under consideration at JINR, MSL, and BNL are based on these simulations.

  17. Rhenium ion beam for implantation into semiconductors

    SciTech Connect

    Kulevoy, T. V.; Seleznev, D. N.; Alyoshin, M. E.; Kraevsky, S. V.; Yakushin, P. E.; Khoroshilov, V. V.; Gerasimenko, N. N.; Smirnov, D. I.; Fedorov, P. A.; Temirov, A. A.

    2012-02-15

    At the ion source test bench in Institute for Theoretical and Experimental Physics the program of ion source development for semiconductor industry is in progress. In framework of the program the Metal Vapor Vacuum Arc ion source for germanium and rhenium ion beam generation was developed and investigated. It was shown that at special conditions of ion beam implantation it is possible to fabricate not only homogenous layers of rhenium silicides solid solutions but also clusters of this compound with properties of quantum dots. At the present moment the compound is very interesting for semiconductor industry, especially for nanoelectronics and nanophotonics, but there is no very developed technology for production of nanostructures (for example quantum sized structures) with required parameters. The results of materials synthesis and exploration are presented.

  18. Proposed LLNL electron beam ion trap

    SciTech Connect

    Marrs, R.E.; Egan, P.O.; Proctor, I.; Levine, M.A.; Hansen, L.; Kajiyama, Y.; Wolgast, R.

    1985-07-02

    The interaction of energetic electrons with highly charged ions is of great importance to several research fields such as astrophysics, laser fusion and magnetic fusion. In spite of this importance there are almost no measurements of electron interaction cross sections for ions more than a few times ionized. To address this problem an electron beam ion trap (EBIT) is being developed at LLNL. The device is essentially an EBIS except that it is not intended as a source of extracted ions. Instead the (variable energy) electron beam interacting with the confined ions will be used to obtain measurements of ionization cross sections, dielectronic recombination cross sections, radiative recombination cross sections, energy levels and oscillator strengths. Charge-exchange recombinaion cross sections with neutral gasses could also be measured. The goal is to produce and study elements in many different charge states up to He-like xenon and Ne-like uranium. 5 refs., 2 figs.

  19. Medical applications of ion beam processes

    NASA Astrophysics Data System (ADS)

    Sioshansi, P.

    The use of ions beams for treatment of surfaces in medical prostheses has gained increasing interest in the past few years. The application of ion beams has taken different forms: (1) ion implantation has been used for increasing the hardness and wear resistance of the new generation titanium based alloys, as well as reducing the wear of the mating polyethylene component used in orthopedic total joint replacement. Spire Corporation has been successful in commercializing ion implantation technology and is processing several thousand artificial knees and hips per year. (Spire uses the tradename IONGUARD™ for this application.) (2) Similarly, ion implantation has proven to be very effective for increasing the corrosion resistance of the Co-Cr based alloys that have traditionally been used in orthopedic prostheses. This application should be of particular interest in resolving the issues surrounding ion release problems associated with these alloys. (3) Ion beam etching/milling has been used for producing a highly textured surface for tissue ingrowth in applications ranging from porous orthopedic implants and percutaneous devices to artificial skin and the process should have a significant impact in this application. (4) There are indications that ion implantation is a useful process for increasing biocompatibility and tissue attachment on metallic samples. This subject deserves considerable attention in the coming years.

  20. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanisms and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  1. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanism and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  2. Multiple Electron Stripping of Heavy Ion Beams

    SciTech Connect

    D. Mueller; L. Grisham; I. Kaganovich; R. L. Watson; V. Horvat; K. E. Zaharakis; Y. Peng

    2002-06-25

    One approach being explored as a route to practical fusion energy uses heavy ion beams focused on an indirect drive target. Such beams will lose electrons while passing through background gas in the target chamber, and therefore it is necessary to assess the rate at which the charge state of the incident beam evolves on the way to the target. Accelerators designed primarily for nuclear physics or high energy physics experiments utilize ion sources that generate highly stripped ions in order to achieve high energies economically. As a result, accelerators capable of producing heavy ion beams of 10 to 40 Mev/amu with charge state 1 currently do not exist. Hence, the stripping cross-sections used to model the performance of heavy ion fusion driver beams have, up to now, been based upon theoretical calculations. We have investigated experimentally the stripping of 3.4 Mev/amu Kr 7+ and Xe +11 in N2; 10.2 MeV/amu Ar +6 in He, N2, Ar and Xe; 19 MeV/amu Ar +8 in He, N2, Ar and Xe; 30 MeV He 1 + in He, N2, Ar and Xe; and 38 MeV/amu N +6 in He, N2, Ar and Xe. The results of these measurements are compared with the theoretical calculations to assess their applicability over a wide range of parameters.

  3. Single impacts of keV fullerene ions on free standing graphene: Emission of ions and electrons from confined volume

    NASA Astrophysics Data System (ADS)

    Verkhoturov, Stanislav V.; Geng, Sheng; Czerwinski, Bartlomiej; Young, Amanda E.; Delcorte, Arnaud; Schweikert, Emile A.

    2015-10-01

    We present the first data from individual C60 impacting one to four layer graphene at 25 and 50 keV. Negative secondary ions and electrons emitted in transmission were recorded separately from each impact. The yields for Cn- clusters are above 10% for n ≤ 4, they oscillate with electron affinities and decrease exponentially with n. The result can be explained with the aid of MD simulation as a post-collision process where sufficient vibrational energy is accumulated around the rim of the impact hole for sputtering of carbon clusters. The ionization probability can be estimated by comparing experimental yields of Cn- with those of Cn0 from MD simulation, where it increases exponentially with n. The ionization probability can be approximated with ejecta from a thermally excited (3700 K) rim damped by cluster fragmentation and electron detachment. The experimental electron probability distributions are Poisson-like. On average, three electrons of thermal energies are emitted per impact. The thermal excitation model invoked for Cn- emission can also explain the emission of electrons. The interaction of C60 with graphene is fundamentally different from impacts on 3D targets. A key characteristic is the high degree of ionization of the ejecta.

  4. Single impacts of keV fullerene ions on free standing graphene: Emission of ions and electrons from confined volume

    SciTech Connect

    Verkhoturov, Stanislav V.; Geng, Sheng; Schweikert, Emile A.; Czerwinski, Bartlomiej; Young, Amanda E.; Delcorte, Arnaud

    2015-10-28

    We present the first data from individual C{sub 60} impacting one to four layer graphene at 25 and 50 keV. Negative secondary ions and electrons emitted in transmission were recorded separately from each impact. The yields for C{sub n}{sup −} clusters are above 10% for n ≤ 4, they oscillate with electron affinities and decrease exponentially with n. The result can be explained with the aid of MD simulation as a post-collision process where sufficient vibrational energy is accumulated around the rim of the impact hole for sputtering of carbon clusters. The ionization probability can be estimated by comparing experimental yields of C{sub n}{sup −} with those of C{sub n}{sup 0} from MD simulation, where it increases exponentially with n. The ionization probability can be approximated with ejecta from a thermally excited (3700 K) rim damped by cluster fragmentation and electron detachment. The experimental electron probability distributions are Poisson-like. On average, three electrons of thermal energies are emitted per impact. The thermal excitation model invoked for C{sub n}{sup −} emission can also explain the emission of electrons. The interaction of C{sub 60} with graphene is fundamentally different from impacts on 3D targets. A key characteristic is the high degree of ionization of the ejecta.

  5. Acceleration of ampere class H(-) ion beam by MeV accelerator.

    PubMed

    Taniguchi, M; Inoue, T; Umeda, N; Kashiwagi, M; Watanabe, K; Tobari, H; Dairaku, M; Sakamoto, K

    2008-02-01

    The H(-) ion accelerator R&D to realize the international thermonuclear experimental reactor neutral beam is ongoing at Japan Atomic Energy Agency (JAEA). The required performance for the prototype MeV accelerator developed at JAEA is 1 MeV, 500 mA (current density of 200 A/m(2)) H(-) ion beam at the beamlet divergence angle of less than 7 mrad. Up to 2005, 836 keV, 146 A/m(2) H(-) ion beam was successfully accelerated as the highest record of the current density at MeV class energy beams. In the present work, high current negative ion beam acceleration test was performed by increasing the beam extraction apertures from 3 x 3 (9 apertures) to 3 x 5 (15 apertures). By fixing the air leak at the source chamber due to backstream ions as well as the improvement of voltage holding capability by a new fiber reinforced plastic insulator ring, the performance of the MeV accelerator was improved. So far, H(-) ion beam of 320 mA was successfully accelerated up to 796 keV with the beam divergence angle of 5.5 mrad. The accelerated drain current including the electron reaches close to the power supply limit for the MeV test facility. The heat flux by the backstream ion during the above beam acceleration was estimated to be 360 W/cm(2). The Cs leakage to the accelerator during the test campaign (Cs total input of 5.0 g) was 0.26 mg (7.0 microg/cm(2)). This is considered to be the allowable level from the viewpoint of voltage holding. PMID:18315236

  6. Ranges of Channelled keV B Ions in Si Crystals with Impact Parameter Dependent Stopping Power

    NASA Astrophysics Data System (ADS)

    Kabadayi, Önder

    In this study we calculated channelled ion ranges of boron ions by using an impact parameter dependent stopping power model. Impact parameter dependent stopping powers for boron ions penetrating into Si <100> are investigated first for energies from 10 to 150 keV. We assumed that impact parameter dependent stopping powers can be expressed by a modified Oen-Robinson formula [1] (Oen et al. Nucl. Instr. Meth. B132, 647 (1976)). The model is implemented by developing a computer code to solve a differential equation numerically for which mean ion ranges can be obtained. The results are compared with experimental data as well as Crystal-TRIM, SRIM and similar procedures calculating ion ranges in solids. We have found an agreement between our results and literature.

  7. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    NASA Astrophysics Data System (ADS)

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-01

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15 V before neutralization to 0.3 V, implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established ˜5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-μs surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of μs after the high voltage pulse is applied. It is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.

  8. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    DOE PAGESBeta

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-27

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15V before neutralization to 0.3 V,more » implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established similar to –5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-mu s surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of mu s after the high voltage pulse is applied. Lastly, it is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.« less

  9. Resonant Ionization Laser Ion Source for Radioactive Ion Beams

    SciTech Connect

    Liu, Yuan; Beene, James R; Havener, Charles C; Vane, C Randy; Gottwald, T.; Wendt, K.; Mattolat, C.; Lassen, J.

    2009-01-01

    A resonant ionization laser ion source based on all-solid-state, tunable Ti:Sapphire lasers is being developed for the production of pure radioactive ion beams. It consists of a hot-cavity ion source and three pulsed Ti:Sapphire lasers operating at a 10 kHz pulse repetition rate. Spectroscopic studies are being conducted to develop ionization schemes that lead to ionizing an excited atom through an auto-ionization or a Rydberg state for numerous elements of interest. Three-photon resonant ionization of 12 elements has been recently demonstrated. The overall efficiency of the laser ion source measured for some of these elements ranges from 1 to 40%. The results indicate that Ti:Sapphire lasers could be well suited for laser ion source applications. The time structures of the ions produced by the pulsed lasers are investigated. The information may help to improve the laser ion source performance.

  10. Variable-spot ion beam figuring

    NASA Astrophysics Data System (ADS)

    Wu, Lixiang; Qiu, Keqiang; Fu, Shaojun

    2016-03-01

    This paper introduces a new scheme of ion beam figuring (IBF), or rather variable-spot IBF, which is conducted at a constant scanning velocity with variable-spot ion beam collimated by a variable diaphragm. It aims at improving the reachability and adaptation of the figuring process within the limits of machine dynamics by varying the ion beam spot size instead of the scanning velocity. In contrast to the dwell time algorithm in the conventional IBF, the variable-spot IBF adopts a new algorithm, which consists of the scan path programming and the trajectory optimization using pattern search. In this algorithm, instead of the dwell time, a new concept, integral etching time, is proposed to interpret the process of variable-spot IBF. We conducted simulations to verify its feasibility and practicality. The simulation results indicate the variable-spot IBF is a promising alternative to the conventional approach.

  11. Neutral Beam Ion Loss Modeling for NSTX

    SciTech Connect

    D. Mikkelsen; D.S. Darrow; L. Grisham; R. Akers; S. Kaye

    1999-06-01

    A numerical model, EIGOL, has been developed to calculate the loss rate of neutral beam ions from NSTX and the resultant power density on the plasma facing components. This model follows the full gyro-orbit of the beam ions, which can be a significant fraction of the minor radius. It also includes the three-dimensional structure of the plasma facing components inside NSTX. Beam ion losses from two plasma conditions have been compared: {beta} = 23%, q{sub 0} = 0.8, and {beta} = 40%, q{sub 0} = 2.6. Global losses are computed to be 4% and 19%, respectively, and the power density on the rf antenna is near the maximum tolerable levels in the latter case.

  12. Probe measurements in ion-beam plasma

    SciTech Connect

    Dudin, S.V.

    1994-12-31

    The particularities of the electric probe measurements in the ion-beam plasma (IBP) have been investigated. To find the electron density n{sub e} and temperature T{sub c} as well as electron energy distribution it is necessary to separate electron current from full probe current, because ion part of this current is often large enough to mask the electron part. According to collisionless probe theory, radius of ion layer in strongly non-isothermal plasma (as in their case) and consequently the ion current are determined by Child`s law. However, at presence of ion beam with high enough energy {var_epsilon}{sub b} >> e{var_phi}{sub p}, this law is broken. The author has found the dependence of Langmuir probe ion current I{sub i} on probe potential {var_phi}{sub p} at presence of IB. The constant ion density approach was used in cylindrical and spherical geometry of the probe layer. Dependence of ion current founded experimentally accords with Child`s law when the probe is placed outside the beam and linear--within the beam. Application of only the chemical Langmuir probe is insufficient for energoanalysis of IBP electrons because of ion current interference. To solve this problem combination of the techniques of cylindrical probe, large plate probe (5 x 5mm) and two-grid energoanalyzer was used. Design and parameters of the two-grid analyzer are presented. Measuring system is described for determination of electron energy distribution function in low temperature plasma by double differentiation of the electric probe volt-ampere characteristic by modulation method.

  13. Ion beam lithography with gold and silicon ions

    NASA Astrophysics Data System (ADS)

    Seniutinas, Gediminas; Balčytis, Armandas; Nishijima, Yoshiaki; Nadzeyka, Achim; Bauerdick, Sven; Juodkazis, Saulius

    2016-04-01

    Different ion species deliver a different material sputtering yield and implantation depth, thus enabling focused ion beam (FIB) fabrication for diverse applications. Using newly developed FIB milling with double charged hbox {Au}^{2+} and hbox {Si}^{2+} ions, fabrication has been carried out on Au-sputtered films to define arrays of densely packed nanoparticles supporting optical extinction peaks at visible-IR wavelengths determined by the size, shape, and proximity of nanoparticles. Results are qualitatively compared with hbox {Ga}+ milling. A possibility to use such ion implantation to tailor the etching rate of silicon is also demonstrated.

  14. Scanning He+ Ion Beam Microscopy and Metrology

    SciTech Connect

    Joy, David C.

    2011-11-10

    The CD-SEM has been the tool of choice for the imaging and metrology of semiconductor devices for the past three decades but now, with critical dimensions at the nanometer scale, electron beam instruments can no longer deliver adequate performance. A scanning microscope using a He+ ion beam offers superior resolution and depth of field, and provides enhanced imaging contrast. Device metrology performed using ion beam imaging produces data which is comparable to or better than that from a conventional CD-SEM although there are significant differences in the experimental conditions required and in the details of image formation. The charging generated by a He+ beam, and the sample damage that it can cause, require care in operation but are not major problems.

  15. Physics design of a 100 keV acceleration grid system for the diagnostic neutral beam for international tokamak experimental reactor

    SciTech Connect

    Singh, M. J.; De Esch, H. P. L.

    2010-01-15

    This paper describes the physics design of a 100 keV, 60 A H{sup -} accelerator for the diagnostic neutral beam (DNB) for international tokamak experimental reactor (ITER). The accelerator is a three grid system comprising of 1280 apertures, grouped in 16 groups with 80 apertures per beam group. Several computer codes have been used to optimize the design which follows the same philosophy as the ITER Design Description Document (DDD) 5.3 and the 1 MeV heating and current drive beam line [R. Hemsworth, H. Decamps, J. Graceffa, B. Schunke, M. Tanaka, M. Dremel, A. Tanga, H. P. L. De Esch, F. Geli, J. Milnes, T. Inoue, D. Marcuzzi, P. Sonato, and P. Zaccaria, Nucl. Fusion 49, 045006 (2009)]. The aperture shapes, intergrid distances, and the extractor voltage have been optimized to minimize the beamlet divergence. To suppress the acceleration of coextracted electrons, permanent magnets have been incorporated in the extraction grid, downstream of the cooling water channels. The electron power loads on the extractor and the grounded grids have been calculated assuming 1 coextracted electron per ion. The beamlet divergence is calculated to be 4 mrad. At present the design for the filter field of the RF based ion sources for ITER is not fixed, therefore a few configurations of the same have been considered. Their effect on the transmission of the electrons and beams through the accelerator has been studied. The OPERA-3D code has been used to estimate the aperture offset steering constant of the grounded grid and the extraction grid, the space charge interaction between the beamlets and the kerb design required to compensate for this interaction. All beamlets in the DNB must be focused to a single point in the duct, 20.665 m from the grounded grid, and the required geometrical aimings and aperture offsets have been calculated.

  16. Physics design of a 100 keV acceleration grid system for the diagnostic neutral beam for international tokamak experimental reactor.

    PubMed

    Singh, M J; De Esch, H P L

    2010-01-01

    This paper describes the physics design of a 100 keV, 60 A H(-) accelerator for the diagnostic neutral beam (DNB) for international tokamak experimental reactor (ITER). The accelerator is a three grid system comprising of 1280 apertures, grouped in 16 groups with 80 apertures per beam group. Several computer codes have been used to optimize the design which follows the same philosophy as the ITER Design Description Document (DDD) 5.3 and the 1 MeV heating and current drive beam line [R. Hemsworth, H. Decamps, J. Graceffa, B. Schunke, M. Tanaka, M. Dremel, A. Tanga, H. P. L. De Esch, F. Geli, J. Milnes, T. Inoue, D. Marcuzzi, P. Sonato, and P. Zaccaria, Nucl. Fusion 49, 045006 (2009)]. The aperture shapes, intergrid distances, and the extractor voltage have been optimized to minimize the beamlet divergence. To suppress the acceleration of coextracted electrons, permanent magnets have been incorporated in the extraction grid, downstream of the cooling water channels. The electron power loads on the extractor and the grounded grids have been calculated assuming 1 coextracted electron per ion. The beamlet divergence is calculated to be 4 mrad. At present the design for the filter field of the RF based ion sources for ITER is not fixed, therefore a few configurations of the same have been considered. Their effect on the transmission of the electrons and beams through the accelerator has been studied. The OPERA-3D code has been used to estimate the aperture offset steering constant of the grounded grid and the extraction grid, the space charge interaction between the beamlets and the kerb design required to compensate for this interaction. All beamlets in the DNB must be focused to a single point in the duct, 20.665 m from the grounded grid, and the required geometrical aimings and aperture offsets have been calculated. PMID:20113091

  17. Crystal-amorphous-silicon interface kinetics under ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Priolo, F.; La Ferla, A.; Spinella, C.; Rimini, E.; Campisano, S. U.; Ferla, G.

    1990-01-01

    Our recent work on ion-beam-assisted epitaxial growth of amorphous Si layers on single crystal substrates is reviewed. The crystallization was induced by a 600 keV Kr2+ beam at a dose rate of 1×1012/cm2 · s. During irradiations the samples were mounted on a resistively heated copper block whose temperature was maintained constant in the range 250-450°C. The planar motion of the crystal-amorphous interface was monitored in situ by dynamic reflectivity measurements. This technique allows the ion-induced growth rate to be measured with a very high precision. We have observed that this growth rate scales linearly with the energy deposited into elastic collisions at the crystal-amorphous interface by the impinging ions. Moreover, the rate shows an Arrhenius temperature dependence with a well defined activation energy of 0.32±0.05 eV. The dependence of this process on substrate orientation and on impurities either dissolved in the amorphous layer or present at very high concentration at the crystal-amorphous interface is also discussed.

  18. Crystal-amorphous-silicon interface kinetics under ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Priolo, F.; La Ferla, A.; Spinella, C.; Rimini, E.; Campisano, S. U.; Ferla, G.

    1989-11-01

    Our recent work on ion-beam-assisted epitaxial growth of amorphous Si layers on single crystal substrates is reviewed. The crystallization was induced by a 600 keV Kr 2+ beam at a dose rate of 1×10 12/cm 2 · s. During irradiations the samples were mounted on a resistively heated copper block whose temperature was maintained constant in the range 250-450°C. The planar motion of the crystal-amorphous interface was monitored in situ by dynamic reflectivity measurements. This technique allows the ion-induced growth rate to be measured with a very high precision. We have observed that this growth rate scales linearly with the energy deposited into elastic collisions at the crystal-amorphous interface by the impinging ions. Moreover, the rate shows an Arrhenius temperature dependence with a well defined activation energy of 0.32±0.05 eV. The dependence of this process on substrate orientation and on impurities either dissolved in the amorphous layer or present at very high concentration at the crystal-amorphous interface is also discussed.

  19. High-ion temperature experiments with negative-ion-based neutral beam injection heating in Large Helical Device

    NASA Astrophysics Data System (ADS)

    Takeiri, Y.; Morita, S.; Tsumori, K.; Ikeda, K.; Oka, Y.; Osakabe, M.; Nagaoka, K.; Goto, M.; Miyazawa, J.; Masuzaki, S.; Ashikawa, N.; Yokoyama, M.; Murakami, S.; Narihara, K.; Yamada, I.; Kubo, S.; Shimozuma, T.; Inagaki, S.; Tanaka, K.; Peterson, B. J.; Ida, K.; Kaneko, O.; Komori, A.; LHD Experimental Group

    2005-07-01

    High-Z plasmas have been produced with Ar and/or Ne gas fuelling to increase the ion temperature in Large Helical Device (LHD) plasmas heated with high-energy negative-ion-based neutral beam injection (NBI). Although the electron heating is dominant in the high-energy NBI heating, the direct ion heating power is significantly enhanced in low-density plasmas due to both an increase in the beam absorption (ionization) power and a reduction of the ion density in the high-Z plasmas. Intensive neon- and/or argon-glow discharge cleaning works well to suppress dilution of the high-Z plasmas with wall-absorbed hydrogen. As a result, the ion temperature increases with an increase in the ion heating power normalized by the ion density and reaches 10 keV. An increase in the ion temperature is also observed with the addition of centrally focused electron cyclotron resonance heating to a low-density and high-Z NBI plasma, suggesting improvement of the ion transport. The results obtained in the high-Z plasma experiments with high-energy NBI heating suggest that an increase in the direct ion heating power and improvement of the ion transport are essential to ion temperature rise, and that a high-ion temperature could be obtained as well in hydrogen plasmas with low-energy positive-NBI heating which is planned in the near future in the LHD.

  20. Generation of broad ion beams in sources based on Penning system with nonequipotential cathode

    NASA Astrophysics Data System (ADS)

    Nikulin, S. P.; Chichigin, D. F.; Tretnikov, P. V.

    2004-05-01

    A method of generation of uniform plasma in low-pressure glow discharges with oscillating electrons has been developed. The method is based on the separation of the cathode into several elements, with potentials of the parts being different. Experimental results show that the use of the nonequipotential cathode in the Penning system enables effective control of spatial plasma distribution. This makes it possible to obtain nearly uniform ion emission current distributions and to form broad beams. Two variants of ion sources are under investigation. The first source generates low energy (˜1 keV) ions, which are often used for cleaning of surfaces. A treated target plays a role in one of the cathodes and acceleration of ions is realized directly in the cathode sheath. The required level of ion energy is provided by applying a corresponding voltage between the target and the anode of the system. The second source generates an ion beam with higher (several tens of keV) energy. Accelerating-decelerating ion optics is used in this variant. The efficiency of ion extraction, defined as the ratio of beam and discharge currents, is equal to 30%.

  1. Plasma focus ion beam-scaling laws

    NASA Astrophysics Data System (ADS)

    Saw, S. H.

    2014-08-01

    Measurements on plasma focus ion beams include various advanced techniques producing a variety of data which has yet to produce benchmark numbers. Recent numerical experiments using an extended version of the Lee Code has produced reference numbers and scaling trends for number and energy fluence of deuteron beams as functions of stored energy E0. At the pinch exit the ion number fluence (ions m-2) and energy fluence (J m-2) computed as 2.4-7.8×1020 and 2.2-33×106 respectively were found to be independent of E0 from 0.4 - 486 kJ. This work was extended to the ion beams for various gases. The results show that, for a given plasma focus, the fluence, flux, ion number and ion current decrease from the lightest to the heaviest gas except for trend-breaking higher values for Ar fluence and flux. The energy fluence, energy flux, power flow and damage factors are relatively constant from H2 to N2 but increase for Ne, Ar, Kr and Xe due to radiative cooling and collapse effects. This paper reviews this work and in a concluding section attempts to put the accumulating large amounts of data into the form of a scaling law of beam energy Ebeam versus storage energy E0 taking the form for deuteron as: {Ebeam} = 18.2{E}01.23; where Ebeam is in J and E0 is in kJ. It is hoped that the establishment of such scaling laws places on a firm footing the reference quantitative ideas for plasma focus ion beams.

  2. Overview of Light-Ion Beam Therapy

    SciTech Connect

    Chu, William T.

    2006-03-16

    In 1930, Ernest Orlando Lawrence at the University of California at Berkeley invented the cyclotron. One of his students, M. Stanley Livingston, constructed a 13-cm diameter model that had all the features of early cyclotrons, accelerating protons to 80 keV using less than 1 kV on a semi-circular accelerating electrode, now called the ''dee''. Soon after, Lawrence constructed the first two-dee 27-Inch (69-cm) Cyclotron, which produced protons and deuterons of 4.8 MeV. In 1939, Lawrence constructed the 60-Inch (150-cm) Cyclotron, which accelerated deuterons to 19 MeV. Just before WWII, Lawrence designed a 184-inch cyclotron, but the war prevented the building of this machine. Immediately after the war ended, the Veksler-McMillan principle of phase stability was put forward, which enabled the transformation of conventional cyclotrons to successful synchrocyclotrons. When completed, the 184-Inch Synchrocyclotron produced 340-MeV protons. Following it, more modern synchrocyclotrons were built around the globe, and the synchrocyclotrons in Berkeley and Uppsala, together with the Harvard cyclotron, would perform pioneering work in treatment of human cancer using accelerated hadrons (protons and light ions). When the 184-Inch Synchrocyclotron was built, Lawrence asked Robert Wilson, one of his former graduate students, to look into the shielding requirements for of the new accelerator. Wilson soon realized that the 184-Inch would produce a copious number of protons and other light ions that had enough energy to penetrate human body, and could be used for treatment of deep-seated diseases. Realizing the advantages of delivering a larger dose in the Bragg peak when placed inside deep-seated tumors, he published in a medical journal a seminal paper on the rationale to use accelerated protons and light ions for treatment of human cancer. The precise dose localization provided by protons and light ions means lower doses to normal tissues adjacent to the treatment volume

  3. High-powered pulsed-ion-beam acceleration and transport

    SciTech Connect

    Humphries, S. Jr.; Lockner, T.R.

    1981-11-01

    The state of research on intense ion beam acceleration and transport is reviewed. The limitations imposed on ion beam transport by space charge effects and methods available for neutralization are summarized. The general problem of ion beam neutralization in regions free of applied electric fields is treated. The physics of acceleration gaps is described. Finally, experiments on multi-stage ion acceleration are summarized.

  4. Beam Control for Ion Induction Accelerators

    SciTech Connect

    Sangster, T.C.; Ahle, L.

    2000-02-17

    Coordinated bending and acceleration of an intense space-charge-dominated ion beam has been achieved for the first time. This required the development of a variable waveform, precision, bi-polar high voltage pulser and a precision, high repetition rate induction core modulator. Waveforms applied to the induction cores accelerate the beam as the bi-polar high voltage pulser delivers a voltage ramp to electrostatic dipoles which bend the beam through a 90 degree permanent magnet quadrupole lattice. Further work on emittance minimization is also reported.

  5. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Chang, O.; Wang, J.

    2011-05-20

    Full particle PIC simulations are performed to study the neutralization of an ion beam in the cohesionless, mesothermal regime. Simulations further confirmed that neutralization is achieved through interactions between the trapped electrons and the potential well established by the propagation of the beam front along the beam direction and is not through plasma instabilities as previous studies suggested. In the transverse direction, the process is similar to that of the expansion of mesothermal plasma into vacuum. Parametric simulations are also performed to investigate the effects of beam radius and domain boundary condition on the neutralization process. The results suggests that, while the qualitative behavior may be similar in ground tests, quantitative parameters such as the beam potential will be affected significantly by the vacuum chamber because of the limits imposed on the expansion process by the finite chamber space.

  6. Beam dynamics in heavy ion fusion

    SciTech Connect

    Seidl, P.

    1995-04-01

    A standard design for heavy ion fusion drivers under study in the US is an induction linac with electrostatic focusing at low energy and magnetic focusing at higher energy. The need to focus the intense beam to a few-millimeter size spot at the deuterium-tritium target establishes the emittance budget for the accelerator. Economic and technological considerations favor a larger number of beams in the low-energy, electrostatic-focusing section than in the high-energy, magnetic-focusing section. Combining four beams into a single focusing channel is a viable option, depending on the growth in emittance due to the combining process. Several significant beam dynamics issues that are, or have been, under active study are discussed: large space charge and image forces, beam wall clearances, halos, alignment, longitudinal instability, and bunch length control.

  7. Using neutral beams as a light ion beam probe (invited)

    SciTech Connect

    Chen, Xi; Heidbrink, W. W.; Van Zeeland, M. A.; Pace, D. C.; Petty, C. C.; Fisher, R. K.; Kramer, G. J.; Nazikian, R.; Austin, M. E.; Hanson, J. M.; Zeng, L.

    2014-11-15

    By arranging the particle first banana orbits to pass near a distant detector, the light ion beam probe (LIBP) utilizes orbital deflection to probe internal fields and field fluctuations. The LIBP technique takes advantage of (1) the in situ, known source of fast ions created by beam-injected neutral particles that naturally ionize near the plasma edge and (2) various commonly available diagnostics as its detector. These born trapped particles can traverse the plasma core on their inner banana leg before returning to the plasma edge. Orbital displacements (the forces on fast ions) caused by internal instabilities or edge perturbing fields appear as modulated signal at an edge detector. Adjustments in the q-profile and plasma shape that determine the first orbit, as well as the relative position of the source and detector, enable studies under a wide variety of plasma conditions. This diagnostic technique can be used to probe the impact on fast ions of various instabilities, e.g., Alfvén eigenmodes (AEs) and neoclassical tearing modes, and of externally imposed 3D fields, e.g., magnetic perturbations. To date, displacements by AEs and by externally applied resonant magnetic perturbation fields have been measured using a fast ion loss detector. Comparisons with simulations are shown. In addition, nonlinear interactions between fast ions and independent AE waves are revealed by this technique.

  8. Fabricating high-density magnetic storage elements by low-dose ion beam irradiation

    SciTech Connect

    Neb, R.; Sebastian, T.; Pirro, P.; Hillebrands, B.; Pofahl, S.; Schaefer, R.; Reuscher, B.

    2012-09-10

    We fabricate magnetic storage elements by irradiating an antiferromagnetically coupled ferromagnetic/nonmagnetic/ferromagnetic trilayer by a low-dose ion beam. The irradiated areas become ferromagnetically coupled and are capable of storing information if their size is small enough. We employ Fe/Cr/Fe trilayers and a 30 keV focused Ga{sup +}-ion beam to demonstrate the working principle for a storage array with a bit density of 7 Gbit/in.{sup 2}. Micromagnetic simulations suggest that bit densities of at least two magnitudes of order larger should be possible.

  9. A second-generation ion beam buncher and cooler for LEBIT

    NASA Astrophysics Data System (ADS)

    Schwarz, Stefan; Bollen, Georg; Lawton, Don; Ringle, Ryan; Schury, Peter; Sun, Tao; Vanwasshenova, Daniel; Wiggins, Dave

    2002-10-01

    The Low Energy Beam and Ion Trap (LEBIT) Project aims to convert the DC beam of high-energy fragmentation products at NSCL/MSU into low-energy low-emittance ion pulses. This beam manipulation will be done in two steps. First a high-pressure gas stopping cell reduces the beam energy from 100-150MeV/u to several keV. A radiofrequency quadrupole (RFQ) ion buncher then accumulates and cools the beam before it is released as ion pulses. Compared to RFQ ion bunchers used elsewhere several design changes have been made: a) The cooling and the bunching of ions is performed in separate sections. A high-pressure part allows for fast cooling whereas a low-pressure trapping region forms ion bunches with low energy-spread. b) A novel electrode layout allows to provide the drag force in the cooling section without the need for segmented rods. c) The buncher will be operated at LN2-temperature. Compared to a room-temperature system the emittance of the ejected ion bunches is expected to be a factor of 4 less. Simulations of the performance of LEBIT's ion buncher as well as the design of the device will be presented.

  10. Production of highly charged ion beams from ECR ion sources

    SciTech Connect

    Xie, Z.Q.

    1997-09-01

    Electron Cyclotron Resonance (ECR) ion source development has progressed with multiple-frequency plasma heating, higher mirror magnetic fields and better technique to provide extra cold electrons. Such techniques greatly enhance the production of highly charged ions from ECR ion sources. So far at cw mode operation, up to 300 e{mu}A of O{sup 7+} and 1.15 emA of O{sup 6+}, more than 100 e{mu}A of intermediate heavy ions for charge states up to Ar{sup 13+}, Ca{sup 13+}, Fe{sup 13+}, Co{sup 14+} and Kr{sup 18+}, and tens of e{mu}A of heavy ions with charge states to Kr{sup 26+}, Xe{sup 28+}, Au{sup 35+}, Bi{sup 34+} and U{sup 34+} have been produced from ECR ion sources. At an intensity of at least 1 e{mu}A, the maximum charge state available for the heavy ions are Xe{sup 36+}, Au{sup 46+}, Bi{sup 47+} and U{sup 48+}. An order of magnitude enhancement for fully stripped argon ions (I {ge} 60 enA) also has been achieved. This article will review the ECR ion source progress and discuss key requirement for ECR ion sources to produce the highly charged ion beams.

  11. Crystalline lattice phase-conversion on thin boron nitride films deposited on silicon wafers by an ion beam assisted deposition method

    NASA Astrophysics Data System (ADS)

    Yokota, Katsuhiro; Kimura, Hidekazu; Miyashita, Fumiyoshi

    2007-04-01

    Boron nitride (BN) was deposited on (1 0 0) silicon wafers by using an ion beam assisted deposition system comprised of an electron beam evaporator and a Kaufman ion source. The intensities of XRD-peaks on turbostratic-BN and IR-peaks on hexagonal-BN increased with increasing nitrogen ion beam energy, and decreased after reached a maximum value on a BN film deposited at 2 keV. On the other hand, a XRD-peak on (1 0 0) cubic-BN first was measured on a BN film deposited at 3 keV.

  12. Properties of boron nitride coating films prepared by the ion beam and vapor deposition method (IVD)

    NASA Astrophysics Data System (ADS)

    Andoh, Y.; Ogata, K.; Suzuki, Y.; Kamijo, E.; Satou, M.; Fujimoto, F.

    The authors have studied coating films of boron nitride prepared by the ion implantation and vapor deposition method (IVD method) and it was found that the films consisted of the cubic, wurzite and hexagonal boron nitride. These films were manufactured by bombardment of nitrogen molecular ion with energy 25-40 keV. In the present work, we prepared films by the nitrogen molecular ions with much lower energy than the previous case. Boron was evaporated by electron beam bombardment on substrates of silicon crystal wafers and nitrogen molecular ions with energy 2-25 keV were simultaneously irradiated. Infrared absorption spectra showed a clear and strong peak due to the boron nitride of cubic structures together with a broad peak of hexagonal one. The hardness of the films was tested. The result showed that the films had 3000-5000 Hv which is much harder than titanium carbide.

  13. Physics with fast molecular-ion beams

    SciTech Connect

    Kanter, E.P.

    1980-01-01

    Fast (MeV) molecular-ion beams provide a unique source of energetic projectile nuclei which are correlated in space and time. The recognition of this property has prompted several recent investigations of various aspects of the interactions of these ions with matter. High-resolution measurements on the fragments resulting from these interactions have already yielded a wealth of new information on such diverse topics as plasma oscillations in solids and stereochemical structures of molecular ions as well as a variety of atomic collision phenomena. The general features of several such experiments will be discussed and recent results will be presented.

  14. Long pulse H- ion beam acceleration in MeV accelerator.

    PubMed

    Taniguchi, M; Mizuno, T; Umeda, N; Kashiwagi, M; Watanabe, K; Tobari, H; Kojima, A; Tanaka, Y; Dairaku, M; Hanada, M; Sakamoto, K; Inoue, T

    2010-02-01

    A multiaperture multigrid accelerator called "MeV accelerator" has been developed for neutral beam injection system of international thermonuclear experimental reactor. In the present work, long pulse H(-) ion beam acceleration was performed by the MeV accelerator equipped with new water-cooled grids. At present, the pulse length was extended to 5 s for the beams of 750 keV, 221 mA, and 10 s for the beams of 600 keV, 158 mA. Energy density, defined as products of beam energy (keV), current (mA), and pulse (s) divided by aperture area (m(2)), increased more than one order of magnitude higher compared with original MeV accelerator without water cooling in its grids. At higher energy and current, the grid was melted by beam deflection. Due to this grid melting, breakdowns occurred between the grids, and hence, the pulse length was limited. Beam deflection will be compensated by aperture displacement in next experiment. PMID:20192408

  15. Cluster ion beam assisted fabrication of metallic nanostructures for plasmonic applications

    NASA Astrophysics Data System (ADS)

    Saleem, Iram; Tilakaratne, Buddhi P.; Li, Yang; Bao, Jiming; Wijesundera, Dharshana N.; Chu, Wei-Kan

    2016-08-01

    We report a high-throughput, single-step method for fabricating rippled plasmonic nanostructure arrays via self-assembly induced by oblique angle cluster ion beam irradiation of metal surfaces. This approach does not require lithographic or chemical processes and has the prominent advantage of possible large surface area coverage and applicability to different starting materials. The polarization dependent plasmonic property of the gold nano-ripple is due to their one dimension structure. The localized plasmon resonance frequency of synthesized nano-ripple arrays is tunable by changing nano-ripple dimensions that can be engineered by changing the cluster ion beam irradiation parameters. In this specific case presented, using 30 keV Ar-gas cluster ion beam, we fabricate gold nano-ripple arrays that show localized plasmon resonance in the visible range through near IR range, tunable by varying cluster ion irradiation fluence.

  16. Graphene engineering by neon ion beams

    NASA Astrophysics Data System (ADS)

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-03-01

    Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne+ beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface.

  17. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, Bruce C.; Stutz, Roger A.

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  18. Graphene engineering by neon ion beams.

    PubMed

    Iberi, Vighter; Ievlev, Anton V; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V; Joy, David C; Rondinone, Adam J; Belianinov, Alex; Ovchinnikova, Olga S

    2016-03-29

    Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He(+) and Ne(+) beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne(+) beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface. PMID:26890062

  19. Metal assisted focused-ion beam nanopatterning

    NASA Astrophysics Data System (ADS)

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates.

  20. Metal assisted focused-ion beam nanopatterning.

    PubMed

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates. PMID:27479713

  1. BEARS: Radioactive ion beams at LBNL

    SciTech Connect

    Powell, J.; Guo, F.Q.; Haustein, P.E.

    1998-07-01

    BEARS (Berkeley Experiments with Accelerated Radioactive Species) is an initiative to develop a radioactive ion-beam capability at Lawrence Berkeley National Laboratory. The aim is to produce isotopes at an existing medical cyclotron and to accelerate them at the 88 inch Cyclotron. To overcome the 300-meter physical separation of these two accelerators, a carrier-gas transport system will be used. At the terminus of the capillary, the carrier gas will be separated and the isotopes will be injected into the 88 inch Cyclotron`s Electron Cyclotron Resonance (ECR) ion source. The first radioactive beams to be developed will include 20-min {sup 11}C and 70-sec {sup 14}O, produced by (p,n) and (p,{alpha}) reactions on low-Z targets. A test program is currently being conducted at the 88 inch Cyclotron to develop the parts of the BEARS system. Preliminary results of these tests lead to projections of initial {sup 11}C beams of up to 2.5 {times} 10{sup 7} ions/sec and {sup 14}O beams of 3 {times} 10{sup 5} ions/sec.

  2. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  3. Induction of antioxidant enzyme activity and lipid peroxidation level in ion-beam-bombarded rice seeds

    NASA Astrophysics Data System (ADS)

    Semsang, Nuananong; Yu, LiangDeng

    2013-07-01

    Low-energy ion beam bombardment has been used to mutate a wide variety of plant species. To explore the indirect effects of low-energy ion beam on biological damage due to the free radical production in plant cells, the increase in antioxidant enzyme activities and lipid peroxidation level was investigated in ion-bombarded rice seeds. Local rice seeds were bombarded with nitrogen or argon ion beams at energies of 29-60 keV and ion fluences of 1 × 1016 ions cm-2. The activities of the antioxidant enzymes; superoxide dismutase (SOD), catalase (CAT), ascorbate peroxidase (APX), dehydroascorbate reductase (DHAR), glutathione reductase (GR), glutathione S-transferase (GST) and lipid peroxidation level were assayed in the germinated rice seeds after ion bombardment. The results showed most of the enzyme activities and lipid peroxidation levels in both the argon and nitrogen bombarded samples were higher than those in the natural control. N-ion bombardment could induce higher levels of antioxidant enzyme activities in the rice samples than the Ar-ion bombardment. Additional effects due to the vacuum condition were found to affect activities of some antioxidant enzymes and lipid peroxidation level. This study demonstrates that ion beam bombardment and vacuum condition could induce the antioxidant enzyme activity and lipid peroxidation level which might be due to free radical production in the bombarded rice seeds.

  4. Storage rings for radioactive ion beams

    NASA Astrophysics Data System (ADS)

    Nolden, F.; Dimopoulou, C.; Dolinskii, A.; Steck, M.

    2008-10-01

    Storage rings for radioactive heavy ions can be applied for a wide range of experiments in atomic and nuclear physics. The rare isotope beams are produced in flight via fragmentation or fission of high-intensity primary ions and they circulate in the storage ring at moderately relativistic energies (typically between 0.1 GeV/u up to 1 GeV/u). Due to their production mechanism they are usually highly charged or even fully stripped. The circulating radioactive heavy ion beams can be used to measure nuclear properties such as masses and decay times, which, in turn, can depend strongly on the ionic charge state. The storage rings must have large acceptances and dynamic apertures. The subsequent application of stochastic precooling of the secondary ions which are injected with large transverse and longitudinal emittances, and electron cooling to reach very high phase space densities has turned out to be a helpful tool for experiments with short-lived ions having lifetimes down to a few seconds. Some of these experiments have already been performed at the experimental storage ring ESR at GSI. The storage ring complex of the FAIR project is intended to enhance significantly the range of experimental possibilities. It is planned to extend the scope of experimental possibilities to collisions with electron or antiproton beams.

  5. Laser-cooled bunched ion beam

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    In collaboration with the Arhus group, the laser cooling of a beam bunched by an rf electrode was investigated at the ASTRID storage ring. A single laser is used for unidirectional cooling, since the longitudinal velocity of the beam will undergo {open_quotes}synchrotron oscillations{close_quotes} and the ions are trapped in velocity space. As the cooling proceeds the velocity spread of the beam, as well as the bunch length is measured. The bunch length decreases to the point where it is limited only by the Coulomb repulsion between ions. The measured length is slightly (20-30%) smaller than the calculated limit for a cold beam. This may be the accuracy of the measurement, or may indicate that the beam still has a large transverse temperature so that the longitudinal repulsion is less than would be expected from an absolutely cold beam. Simulations suggest that the coupling between transverse and longitudinal degrees of freedom is strong -- but this issue will have to be resolved by further measurements.

  6. MULTIPLE ELECTRON BEAM ION PUMP AND SOURCE

    DOEpatents

    Ellis, R.E.

    1962-02-27

    A vacuum pump is designed which operates by ionizing incoming air and by withdrawing the ions from the system by means of electrical fields. The apparatus comprises a cylindrical housing communicable with the vessel to be evacuated and having a thin wall section in one end. Suitable coils provide a longitudinal magnetic field within the cylinder. A broad cathode and an anode structure is provided to establish a plurality of adjacent electron beams which are parallel to the cylinder axis. Electron reflector means are provided so that each of the beams constitutes a PIG or reflex discharge. Such structure provides a large region in which incoming gas molecules may be ionized by electron bombardment. A charged electrode assembly accelerates the ions through the thin window, thereby removing the gas from the system. The invention may also be utilized as a highly efficient ion source. (AEC)

  7. Spectroscopy of ions using fast beams and ion traps

    SciTech Connect

    Pinnington, E H; Trabert, E

    2004-10-01

    A knowledge of the spectra of ionized atoms is of importance in many fields. They can be studied in a wide variety of light sources. In recent years techniques coming under the broad heatings of fast beams and ion traps have been used extensively for such investigations. This article considers the advantages that various techniques have for particular applications.

  8. Research and development of H- ion source and low energy beam transport for a kaon-neutrino factory.

    PubMed

    Ji, Q; Staples, J; Sy, A; Schenkel, T; Li, D

    2012-02-01

    A baseline H(-) ion source and low energy beam transport (LEBT) system have been identified for Project X. The filament-discharge H(-) ion source has been fabricated by D-Pace, Inc. and is now in operation at LBNL. The source is capable of delivering over 10 mA of H(-) beam in cw operation with normalized 4 rms emittances less than 0.7 π mm mrad. A two-solenoid magnetic lens LEBT system has been design. The design has been validated with simulations of beam transport for 5 mA 30 keV H(-) beams using various simulation codes. PMID:22380227

  9. Optimization of the beam extraction systems for the Linac4 H{sup −} ion source

    SciTech Connect

    Fink, D. A.; Lettry, J.; Scrivens, R.; Steyaert, D.; Midttun, Ø.; Valerio-Lizarraga, C. A.

    2015-04-08

    The development of the Linac 4 and its integration into CERN’s acceleration complex is part of the foreseen luminosity upgrade of the Large Hadron Collider (LHC). The goal is to inject a 160 MeV H{sup −} beam into the CERN PS Booster (PSB) in order to increase the beam brightness by a factor of 2 compared to the 50 MeV proton linac, Linac 2, that is currently in operation. The requirements for the ion source are a 45 keV H{sup −} beam of 80 mA intensity, 2 Hz repetition rate and 0.5 ms pulse length within a normalized rms-emittance of 0.25 mm· mrad. The previously installed beam extraction system has been designed for an H{sup −} ion beam intensity of 20 mA produced by an RF-volume source with an electron to H{sup −} ratio of up to 50. For the required intensity upgrades of the Linac4 ion source, a new beam extraction system is being produced and tested; it is optimized for a cesiated surface RF-source with a nominal beam current of 40 mA and an electron to H{sup −} ratio of 4. The simulations, based on the IBSIMU code, are presented. At the Brookhaven National Laboratory (BNL), a peak beam current of more than 100 mA was demonstrated with a magnetron H{sup −} source at an energy of 35 keV and a repetition rate of 2 Hz. A new extraction system is required to operate at an energy of 45 keV; simulation of a two stage extraction system dedicated to the magnetron is presented.

  10. Ion acceleration mechanism in electron beams

    SciTech Connect

    Popov, A.F.

    1982-07-01

    Analysis of experimental data reveals that several processes observed in diodes and during the transport of intense electron beams in a neutral gas result from polarization of a plasma in an electric field. Under certain conditions this effect gives rise to a high-field region at the boundary of a plasma column. The electron beam is strongly focused in this region. As a result, a two-dimensional potential well forms at the crossover point of a strongly focused beam. The electric field at this well can reach several megavolts per centimeter. The crossover point moves as a result of expansion of the plasma cloud. The ions trapped in the potential well are accelerated. There is effective acceleration over a distance of the order of a few times the beam radius. A new physical model gives a satisfactory explanation of the experimental results.

  11. Radiation damage and its recovery in focused ion beam fabricated ferroelectric capacitors

    NASA Astrophysics Data System (ADS)

    Stanishevsky, A.; Nagaraj, B.; Melngailis, J.; Ramesh, R.; Khriachtchev, L.; McDaniel, E.

    2002-09-01

    We studied the effect of ion damage on the properties of 50 keV Ga+ focused ion beam fabricated lead-zirconate-titanate capacitors as a function of the ion dose. We observed significant modification in the chemical composition of the damaged layer due to loss of lead and oxygen, and gallium impurity accumulation. The 5-10 nm thick damaged layer becomes dielectric after annealing and does not recover its ferroelectric properties. This dielectric layer substantially reduces the actual volume of the ferroelectric material in sub-100 nm structures, and can affect their performance.

  12. Ion-beam sputtering increases solar-cell efficiency

    NASA Technical Reports Server (NTRS)

    Burk, D. E.; Dubow, J. B.; Sites, R. R.

    1977-01-01

    Ion-beam sputtering, fabrication of oxide-semiconductor-on-silicon (OSOS) solar cells, results in cells of 12% efficiency. Ion-beam sputtering technique is compatible with low-cost continuous fabrication and requires no high-temperature processing.

  13. Ionization at the Noble Gases Ion-Atom Collisions in the 1-7 KeV Energy Range

    NASA Astrophysics Data System (ADS)

    Kikiani, Boris; Chitaladze, Marika; Japaridze, Josif; Kavlashvili, Nana

    2002-10-01

    The absolute total cross sections for production of free electrons, all positive show target gas ions and partial cross sections for production of double charged slow target gas ions at these collisions have been measured. The measurements were carried out by improved transfers electric field ("condenser") and magnetic mass-analyzer methods[1]. It was shown that in the investigated energy range practically there are now slow ions with charged state more than two. Control experiments have been shown that process of electron's liberation from fast particles ("stripping" process) is unlikely in the investigated energy range. Therefore, one can to suppose that total cross sections for productions of free electrons are equal to the total cross sections of ionization of the target gas atoms. For symmetrical pairs of colliding particles (He+ _ He, Ne+ _ Ne , etc) and for pairs He+ _ Ne, Ar+ _ Kr and Kr+ _ Xe values of partial cross-sections are negligible. In the cases of He+ _ Kr and He+ _ Xe pairs value of these partial cross sections increases with colliding energy and reaches about three percent at the energy 4kev. However, in the cases of He+ _ Ar, Na+ _ Ar, Kr, Xe the values of relative portion of the double charged ions in the total amount of slow positive ions are significant (for example in He+ _ Ar collision at the energy of 4kev this portion is about 20-25 percent). Analyzes of the correlation diagrams of the diabetics terms of colliding particles system (MS) [2] show that the electron capture processes are accompanying by simultaneous excitation of auto- ionization states of target gas ions. The decay of these states are responsible for realize of double ionization process of the target gas atoms. 1. B. Kikiani, R.Lomsadze, N. Mosulishvili, Proceedings of Tbilisi State University, Physics, 34, 114, 1999; 2 M. Barat, W.Lichten, Phys. Rev, A6, 211, 1972.

  14. Silicon ion irradiation effects on the magnetic properties of ion beam synthesized CoPt phase

    SciTech Connect

    Balaji, S.; Amirthapandian, S.; Panigrahi, B. K.; Mangamma, G.; Kalavathi, S.; Gupta, Ajay; Nair, K. G. M.

    2012-06-05

    Ion beam mixing of Pt/Co bilayers using self ion (Pt{sup +}) beam results in formation of CoPt phase. Upon ion beam annealing the ion mixed samples using 4 MeV Si{sup +} ions at 300 deg. C, diffusion of Co towards the Pt/Co interface is observed. The Si{sup +} ion beam rotates the magnetization of the CoPt phase from in plane to out of plane of the film.

  15. Inertial confinement fusion with light ion beams.

    PubMed

    Vandevender, J P; Cook, D L

    1986-05-16

    The Particle Beam Fusion Accelerator II (PBFA II) is presently under construction and is the only existing facility with the potential of igniting thermonuclear fuel in the laboratory. The accelerator will generate up to 5 megamperes of lithium ions at 30 million electron volts and will focus them onto an inertial confinement fusion (ICF) target after beam production and focusing have been optimized. Since its inception, the light ion approach to ICF has been considered the one that combines low cost, high risk, and high payoff. The beams are of such high density that their self-generated electric and magnetic fields were thought to prohibit high focal intensities. Recent advances in beam production and focusing demonstrate that these self-forces can be controlled to the degree required for ignition, break-even, and high gain experiments. ICF has been pursued primarily for its potential military applications. However, the high efficiency and cost-effectiveness of the light ion approach enhance its potential for commercial energy application as well. PMID:17755963

  16. Ion beam figuring system in NUDT

    NASA Astrophysics Data System (ADS)

    Zhou, Lin; Xie, Xuhui; Dai, Yifan; Jiao, Changjun; Li, Shengyi

    2007-12-01

    Ion beam figuring (IBF) is an optical fabrication technique that provides highly deterministic process to correct surface figure error of previously polished surfaces by using a directed, inert and neutralized ion beam to physically sputter material from the optic surface. Recently, an ion beam figuring system KDIFS-500 has been designed and built in National University of Defense Technology (NUDT) of the P.R. China. KDIFS-500 is capable of processing workpiece up to Φ500mm. Line scanning process was discussed in detail for estimating the parameters of the beam removal function (BRF) in process. Experiments were conducted to demonstrate that the BRF increases gradually in process and by employing a stability control, the BRF can be kept stable in process. Finally, a Φ95 mm plano optical sample of CVD coated SiC substrate has been figured in two process iterations for demonstrating the correction capability of the KDIFS-500. Their figure convergence ratios reached 5.8 and 2.1 respectively. The actual figure residual errors were basically consistent with the predicted error. These consistencies indicated that the IBF processes on KDIFS-500 are predictable deterministic processes.

  17. High sensitivity charge amplifier for ion beam uniformity monitor

    DOEpatents

    Johnson, Gary W.

    2001-01-01

    An ion beam uniformity monitor for very low beam currents using a high-sensitivity charge amplifier with bias compensation. The ion beam monitor is used to assess the uniformity of a raster-scanned ion beam, such as used in an ion implanter, and utilizes four Faraday cups placed in the geometric corners of the target area. Current from each cup is integrated with respect to time, thus measuring accumulated dose, or charge, in Coulombs. By comparing the dose at each corner, a qualitative assessment of ion beam uniformity is made possible. With knowledge of the relative area of the Faraday cups, the ion flux and areal dose can also be obtained.

  18. Ion energy distribution near a plasma meniscus with beam extraction for multi element focused ion beams

    SciTech Connect

    Mathew, Jose V.; Paul, Samit; Bhattacharjee, Sudeep

    2010-05-15

    An earlier study of the axial ion energy distribution in the extraction region (plasma meniscus) of a compact microwave plasma ion source showed that the axial ion energy spread near the meniscus is small ({approx}5 eV) and comparable to that of a liquid metal ion source, making it a promising candidate for focused ion beam (FIB) applications [J. V. Mathew and S. Bhattacharjee, J. Appl. Phys. 105, 96101 (2009)]. In the present work we have investigated the radial ion energy distribution (IED) under the influence of beam extraction. Initially a single Einzel lens system has been used for beam extraction with potentials up to -6 kV for obtaining parallel beams. In situ measurements of IED with extraction voltages upto -5 kV indicates that beam extraction has a weak influence on the energy spread ({+-}0.5 eV) which is of significance from the point of view of FIB applications. It is found that by reducing the geometrical acceptance angle at the ion energy analyzer probe, close to unidirectional distribution can be obtained with a spread that is smaller by at least 1 eV.

  19. Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams

    SciTech Connect

    Saminathan, S.; Beijers, J. P. M.; Kremers, H. R.; Mironov, V.; Mulder, J.; Brandenburg, S.

    2012-07-15

    A detailed experimental and simulation study of the extraction of a 24 keV He{sup +} beam from an ECR ion source and the subsequent beam transport through an analyzing magnet is presented. We find that such a slow ion beam is very sensitive to space-charge forces, but also that the neutralization of the beam's space charge by secondary electrons is virtually complete for beam currents up to at least 0.5 mA. The beam emittance directly behind the extraction system is 65 {pi} mm mrad and is determined by the fact that the ion beam is extracted in the strong magnetic fringe field of the ion source. The relatively large emittance of the beam and its non-paraxiality lead, in combination with a relatively small magnet gap, to significant beam losses and a five-fold increase of the effective beam emittance during its transport through the analyzing magnet. The calculated beam profile and phase-space distributions in the image plane of the analyzing magnet agree well with measurements. The kinematic and magnet aberrations have been studied using the calculated second-order transfer map of the analyzing magnet, with which we can reproduce the phase-space distributions of the ion beam behind the analyzing magnet. Using the transfer map and trajectory calculations we have worked out an aberration compensation scheme based on the addition of compensating hexapole components to the main dipole field by modifying the shape of the poles. The simulations predict that by compensating the kinematic and geometric aberrations in this way and enlarging the pole gap the overall beam transport efficiency can be increased from 16% to 45%.

  20. Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams.

    PubMed

    Saminathan, S; Beijers, J P M; Kremers, H R; Mironov, V; Mulder, J; Brandenburg, S

    2012-07-01

    A detailed experimental and simulation study of the extraction of a 24 keV He(+) beam from an ECR ion source and the subsequent beam transport through an analyzing magnet is presented. We find that such a slow ion beam is very sensitive to space-charge forces, but also that the neutralization of the beam's space charge by secondary electrons is virtually complete for beam currents up to at least 0.5 mA. The beam emittance directly behind the extraction system is 65 π mm mrad and is determined by the fact that the ion beam is extracted in the strong magnetic fringe field of the ion source. The relatively large emittance of the beam and its non-paraxiality lead, in combination with a relatively small magnet gap, to significant beam losses and a five-fold increase of the effective beam emittance during its transport through the analyzing magnet. The calculated beam profile and phase-space distributions in the image plane of the analyzing magnet agree well with measurements. The kinematic and magnet aberrations have been studied using the calculated second-order transfer map of the analyzing magnet, with which we can reproduce the phase-space distributions of the ion beam behind the analyzing magnet. Using the transfer map and trajectory calculations we have worked out an aberration compensation scheme based on the addition of compensating hexapole components to the main dipole field by modifying the shape of the poles. The simulations predict that by compensating the kinematic and geometric aberrations in this way and enlarging the pole gap the overall beam transport efficiency can be increased from 16% to 45%. PMID:22852683

  1. Advanced design of positive-ion sources for neutral-beam applications

    SciTech Connect

    Marguerat, E.F.; Haselton, H.H.; Menon, M.M.; Schechter, D.E.; Stirling, W.L.; Tsai, C.C.

    1982-01-01

    The APIS ion source is being developed to meet a goal of producing ion beams of less than or equal to 200 keV, 100 A, with 10-30-s pulse lengths. In a continuing effort to advance the state of the art and to produce long pulse ion beams, APIS ion sources with grid dimensions of 10 x 25 cm, 13 x 43 cm, and 16 x 48 cm are being developed. In the past year, the 10- x 25-cm ion source has been operated to produce ion beams in excess of 100 keV for many seconds pulse length. An advanced design concept is being pursued with the primary objectives to improve radiation protection, reduce fabrication costs, and simplify maintenance. The source magnetic sheild will be designed as a vacuum enclosure to house all source components. The electrical insulation requirements of energy recovery are also considered. Because of the frequent maintenance requirements, the electron emitter assembly will be designed with a remote handling capability. A new accelerator design which incorporates the necessary neutron shielding and associated steering gimbal system is also described.

  2. Ion beam emittance from an ECRIS

    NASA Astrophysics Data System (ADS)

    Spädtke, P.; Lang, R.; Mäder, J.; Maimone, F.; Schlei, B. R.; Tinschert, K.; Biri, S.; Rácz, R.

    2016-02-01

    Simulation of ion beam extraction from an Electron Cyclotron Resonance Ion Source (ECRIS) is a fully 3 dimensional problem, even if the extraction geometry has cylindrical symmetry. Because of the strong magnetic flux density, not only the electrons are magnetized but also the Larmor radius of ions is much smaller than the geometrical dimension of the plasma chamber (Ø 64 × 179 mm). If we assume that the influence of collisions is small on the path of particles, we can do particle tracking through the plasma if the initial coordinates of particles are known. We generated starting coordinates of plasma ions by simulation of the plasma electrons, accelerated stochastically by the 14.5 GHz radio frequency power fed to the plasma. With that we were able to investigate the influence of different electron energies on the extracted beam. Using these assumptions, we can reproduce the experimental results obtained 10 years ago, where we monitored the beam profile with the help of viewing targets. Additionally, methods have been developed to investigate arbitrary 2D cuts of the 6D phase space. To this date, we are able to discuss full 4D information. Currently, we extend our analysis tool towards 5D and 6D, respectively.

  3. Ion Beam Etching: Replication of Micro Nano-structured 3D Stencil Masks

    SciTech Connect

    Weber, Patrick; Guibert, Edouard; Mikhailov, Serguei; Bruegger, Juergen; Villanueva, Guillermo

    2009-03-10

    Ion beam LIGA allows the etching of 3D nano-structures by direct writing with a nano-sized beam. However, this is a relatively time consuming process. We propose here another approach for etching structures on large surfaces and faster, compared to the direct writing process. This approach consists of replicating 3D structured masks, by scanning an unfocused ion beam. A polymer substrate is placed behind the mask, as in UV photolithography. But the main advantage is that the 3D structure of the mask can be replicated into the polymer. For that purpose, the masks (developped at LMIS1, EPFL) are made of a silicon nitride membrane 100 nm thick, on which 3D gold structures up to 200 nm thick, are deposited. The 3D Au structures are made with the nanostencil method, based on successive gold deposition. The IMA institute, from HE-Arc, owns a High Voltage Engineering 1.7 MV Tandetron with both solid and gaseous negative ion sources, able to generate ions from almost every chemical element in a broad range of energies comprised between 400 keV and 6.8 MeV. The beam composition and energy are chosen in such a way, that ions lose a significant fraction of their energy when passing through the thickest regions of the mask. Ions passing through thinner regions of the mask loose a smaller fraction of their energy and etch the polymer with larger thicknesses, allowing a replication of the mask into the polymer. For our trials, we have used a carbon beam with an energy of 500 keV. The beam was focussed to a diameter of 5 mm with solid slits, in order to avoid border effects and thus ensure a homogeneous dose distribution on the beam diameter. The feasibility of this technique has been demonstrated, allowing industrial applications for micro-mould fabrication, micro-fluidics and micro-optics.

  4. Fabrication of Al/AlO x /Al junctions using pre-exposure technique at 30-keV e-beam voltage

    NASA Astrophysics Data System (ADS)

    Lan, Dong; Xue, Guangming; Liu, Qiang; Tan, Xinsheng; Yu, Haifeng; Yu, Yang

    2016-08-01

    We fabricate high-quality Al/AlO x /Al junctions using improved bridge and bridge-free techniques at 30-keV e-beam voltage, in which the length of undercut and the size of junction can be well controlled by the pre-exposure technique. The dose window is 5 times as large as that used in the usual Dolan bridge technique, making this technique much more robust. Similar results, comparable with those achieved using a 100-keV e-beam writer, are obtained, which indicate that the 30-keV e-beam writer could be an economic choice for the superconducting qubit fabrication. Project supported by the National Natural Science Foundation of China (Grant Nos. 91321310, 11274156, 11474152, 11474153, 61521001, and 11504165) and the State Key Basic Research Program of China (Grant Nos. 2011CB922104 and 2011CBA00205).

  5. Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

    NASA Astrophysics Data System (ADS)

    Thongkumkoon, P.; Prakrajang, K.; Thopan, P.; Yaopromsiri, C.; Suwannakachorn, D.; Yu, L. D.

    2013-07-01

    Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation.

  6. Ion beam sputter deposited diamond like films

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Rutledge, S. K.

    1982-01-01

    A single argon ion beam source was used to sputter deposit carbon films on fused silica, copper, and tantalum substrates under conditions of sputter deposition alone and sputter deposition combined with simultaneous argon ion bombardment. Simultaneously deposited and ion bombarded carbon films were prepared under conditions of carbon atom removal to arrival ratios of 0, 0.036, and 0.71. Deposition and etch rates were measured for films on fused silica substrates. Resulting characteristics of the deposited films are: electrical resistivity of densities of 2.1 gm/cu cm for sputter deposited films and 2.2 gm/cu cm for simultaneously sputter deposited and Ar ion bombarded films. For films approximately 1700 A thick deposited by either process and at 5550 A wavelength light the reflectance was 0.2, the absorptance was 0.7, the absorption coefficient was 67,000 cm to the -1 and the transmittance was 0.1.

  7. Microdosimetry for a carbon ion beam using track-etched detectors.

    PubMed

    Ambrožová, I; Vondráček, V; Šefl, M; Štěpán, V; Pachnerová Brabcová, K; Ploc, O; Incerti, S; Davídková, M

    2015-09-01

    Track-etched detectors (TED) have been used as linear energy transfer (LET) spectrometers in heavy ion beams for many years. LET spectra and depth-dose distribution of a carbon ion beam were measured behind polymethylmethacrylate degraders at Heavy Ion Medical Accelerator in Chiba, Japan. The measurements were performed along monoenergetic beam with energy 290 MeV u(-1) in different positions: (1) at beam extraction area, (2) at beginning, (3) maximum and (4) behind the Bragg peak region (0, 117, 147 and 151 mm of water-equivalent depth, respectively). The LET spectra inside and outside of the primary ion beam have been evaluated. TED record only heavy charged particles with LET above 8-10 keV µm(-1), while electrons and ions with lower LET are not detected. The Geant4 simulation toolkit version 4.9.6.P01 has been used to estimate the contribution of non-detected particles to absorbed dose. Presented results demonstrate the applicability of TED for microdosimetry measurements in therapeutic carbon ion beams. PMID:25862534

  8. Thermal-spikes temperature measurement in pure metals under argon ion irradiation (E = 5-15 keV)

    NASA Astrophysics Data System (ADS)

    Ovchinnikov, V. V.; Makhin'ko, F. F.; Solomonov, V. I.

    2015-11-01

    A method for determining the parameters of energy release in dense cascades of atomic displacements and for estimating the temperature and the level of pressures in thermalized cascade regions (thermal spikes) is proposed. It is based on the measurement and analysis of the spectral composition of the surface glow of condensed media in the course of irradiation with Ar+ 5-15 keV accelerated ions, under the assumption of the presence of a thermal component of glow defined by the presence of thermalized cascade regions.

  9. Neutral beam dose and sputtering characteristics in an ion implantation system

    NASA Technical Reports Server (NTRS)

    Roberts, A. S., Jr.; Ash, R. L.; Berger, M. H.

    1973-01-01

    A technique and instrument design for calorimetric detection of the neutral atom content of a 60 keV argon ion beam. A beam sampling method is used to measure local heat flux to a small platinum wire at steady state; integration of power density profiles leads to a determination of equivalent neutral beam current. The fast neutral production occurs as a result of charge transfer processes in the region of the beam system between analyzing magnet and beam stop where the pressure remains less than .00001 torr. A description of the neutral beam detector is given in section along with a presentation of results. An elementary analysis of sputter material transport from target to substrate was performed; the analysis relates to semiconductor sputtering.

  10. Ion-beam cleaning for cold welds

    NASA Technical Reports Server (NTRS)

    Slater, B. L.

    1980-01-01

    1000 eV beam bombarding metal surfaces to be joined removes oxides and contaminants at rate of several atomic layers per second for current density of 1 mA/squ. cm. Clean surfaces can then be joined by squeezing them together. With ion-beam cleaning, mating force for strong bond is low enough to cause only 1% deformation. Conventional cold-welding requires about 70% deformation for bonding. Technique was tested successfully on aluminum to aluminum welds, copper to copper, copper to aluminum, copper to nickel, and silver to iron. Base metals failed before welds in tear test.

  11. Transfer Casting From Ion-Beam-Textured Surfaces

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Sovey, J. S.

    1986-01-01

    Textured surfaces created on metals, ceramics, and polymers. Electron-bombardment ion thrustor used as neutralized-ion-beam source. Beam of directed, energetic ions alter surface chemistry and/or morphology of many materials. By adjusting ion energy and ion-beam current density impinging upon target, precise surface modifications obtained without risk of targetmaterial melting or bulk decomposition. Technique developed to generate precise, controllable, surface microstructures on metals, ceramics, and polymers.

  12. 60 keV Ar⁺-ion induced modification of microstructural, compositional, and vibrational properties of InSb

    SciTech Connect

    Datta, D. P.; Garg, S. K.; Som, T.; Satpati, B.; Kanjilal, A.; Dhara, S.; Kanjilal, D.

    2014-10-14

    Room temperature irradiation of InSb(111) by 60 keV Ar⁺-ions at normal (0°) and oblique (60°) angles of incidence led to the formation of nanoporous structure in the high fluence regime of 1×10¹⁷ to 3×10¹⁸ ions cm⁻². While a porous layer comprising of a network of interconnected nanofibers was generated by normal ion incidence, evolution of plate-like structures was observed for obliquely incident ions. Systematic studies of composition and structure using energy dispersive x-ray spectroscopy, Raman spectroscopy, x-ray photoelectron spectroscopy, Raman mapping, grazing incidence x-ray diffraction, and cross-sectional transmission electron microscopy revealed a high degree of oxidation of the ion-induced microstructures with the presence of In₂O₃ and Sb₂O₃ phases and presence of nanocrystallites within the nanoporous structures. The observed structural evolution was understood in terms of processes driven by ion-induced defect accumulation within InSb.

  13. Time resolved ion beam induced charge collection

    SciTech Connect

    SEXTON,FREDERICK W.; WALSH,DAVID S.; DOYLE,BARNEY L.; DODD,PAUL E.

    2000-04-01

    Under this effort, a new method for studying the single event upset (SEU) in microelectronics has been developed and demonstrated. Called TRIBICC, for Time Resolved Ion Beam Induced Charge Collection, this technique measures the transient charge-collection waveform from a single heavy-ion strike with a {minus}.03db bandwidth of 5 GHz. Bandwidth can be expanded up to 15 GHz (with 5 ps sampling windows) by using an FFT-based off-line waveform renormalization technique developed at Sandia. The theoretical time resolution of the digitized waveform is 24 ps with data re-normalization and 70 ps without re-normalization. To preserve the high bandwidth from IC to the digitizing oscilloscope, individual test structures are assembled in custom high-frequency fixtures. A leading-edge digitized waveform is stored with the corresponding ion beam position at each point in a two-dimensional raster scan. The resulting data cube contains a spatial charge distribution map of up to 4,096 traces of charge (Q) collected as a function of time. These two dimensional traces of Q(t) can cover a period as short as 5 ns with up to 1,024 points per trace. This tool overcomes limitations observed in previous multi-shot techniques due to the displacement damage effects of multiple ion strikes that changed the signal of interest during its measurement. This system is the first demonstration of a single-ion transient measurement capability coupled with spatial mapping of fast transients.

  14. Intense Ion Beam Flux of Adsorbed Gases and Metallic Anode Materials in the “Point Pinch Diode” Measured with Thomson-Parabola Ion Spectrometer

    NASA Astrophysics Data System (ADS)

    Sato, Morihiko

    1987-06-01

    An intense flux of ion beams was observed in a “Point Pinch Diode” which consists of concentric elliptic or spherical electrodes and a slender magnetically insulated transmission line. The ion beam had an energy of about 380 keV, which was equivalent to the supplied diode voltage. The peak current density of the ion beam ranged from 5 to 7.5 kA/cm2 in spite of a small input energy (less than about 1 kJ). Measurements with a Thomson-parabola ion spectrometer show that the major components were hydrogen, carbon, and oxygen, the origins of which were oil and water adsorbed on the surface of the metallic anodes. A significant flux of the metallic ion beams was also detected in the cases of aluminium, copper and gold anodes.

  15. Spectrometer for cluster ion beam induced luminescence

    SciTech Connect

    Ryuto, H. Sakata, A.; Takeuchi, M.; Takaoka, G. H.; Musumeci, F.

    2015-02-15

    A spectrometer to detect the ultra-weak luminescence originated by the collision of cluster ions on the surfaces of solid materials was constructed. This spectrometer consists of 11 photomultipliers with band-pass interference filters that can detect the luminescence within the wavelength ranging from 300 to 700 nm and of a photomultiplier without filter. The calibration of the detection system was performed using the photons emitted from a strontium aluminate fluorescent tape and from a high temperature tungsten filament. Preliminary measurements show the ability of this spectrometer to detect the cluster ion beam induced luminescence.

  16. Design study of primary ion provider for relativistic heavy ion collider electron beam ion source.

    PubMed

    Kondo, K; Kanesue, T; Tamura, J; Okamura, M

    2010-02-01

    Brookhaven National Laboratory has developed the new preinjector system, electron beam ion source (EBIS) for relativistic heavy ion collider (RHIC) and National Aeronautics and Space Administration Space Radiation Laboratory. Design of primary ion provider is an essential problem since it is required to supply beams with different ion species to multiple users simultaneously. The laser ion source with a defocused laser can provide a low charge state and low emittance ion beam, and is a candidate for the primary ion source for RHIC-EBIS. We show a suitable design with appropriate drift length and solenoid, which helps to keep sufficient total charge number with longer pulse length. The whole design of primary ion source, as well as optics arrangement, solid targets configuration and heating about target, is presented. PMID:20192366

  17. Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams.

    PubMed

    Sheraz née Rabbani, Sadia; Razo, Irma Berrueta; Kohn, Taylor; Lockyer, Nicholas P; Vickerman, John C

    2015-02-17

    Following from our previous Letter on this topic, this Article reports a detailed study of time-of-flight-secondary ion mass spectrometry (TOF-SIMS) positive ion spectra generated from a set of model biocompounds (arginine, trehalose, DPPC, and angiotensin II) by water cluster primary ion beams in comparison to argon cluster beams over a range of cluster sizes and energies. Sputter yield studies using argon and water beams on arginine and Irganox 1010 have confirmed that the sputter yields using water cluster beams lie on the same universal sputtering curve derived by Seah for argon cluster beams. Thus, increased ion yield using water cluster beams must arise from increased ionization. The spectra and positive ion signals observed using cluster beams in the size range from 1,000 to 10,000 and the energy range 5-20 keV are reported. It is confirmed that water cluster beams enhance proton related ionization over against argon beams to a significant degree such that enhanced detection sensitivities from 1 μm(2) in the region of 100 to 1,000 times relative to static SIMS analysis with Ar2000 cluster beams appear to be accessible. These new studies show that there is an unexpected complexity in the ionization enhancement phenomenon. Whereas optimum ion yields under argon cluster bombardment occur in the region of E/n ≥ 10 eV (where E is the beam energy and n the number of argon atoms in the cluster) and fall rapidly when E/n < 10 eV; for water cluster beams, ion yields increase significantly in this E/n regime (where n is the number of water molecules in the cluster) and peak for 20 keV beams at a cluster size of 7,000 or E/n ∼3 eV. This important result is explored further using D2O cluster beams that confirm that in this low E/n regime protonation does originate to a large extent from the water molecules. The results, encouraging in themselves, suggest that for both argon and water cluster beams, higher energy beams, e.g., 40 and 80 keV, would enable larger

  18. Ion beam sputter etching of orthopedic implanted alloy MP35N and resulting effects on fatigue

    NASA Technical Reports Server (NTRS)

    Wintucky, E. G.; Christopher, M.; Bahnuik, E.; Wang, S.

    1981-01-01

    The effects of two types of argon ion sputter etched surface structures on the tensile stress fatigue properties of orthopedic implant alloy MP35N were investigated. One surface structure was a natural texture resulting from direct bombardment by 1 keV argon ions. The other structure was a pattern of square holes milled into the surface by a 1 keV argon ion beam through a Ni screen mask. The etched surfaces were subjected to tensile stress only in fatigue tests designed to simulate the cyclic load conditions experienced by the stems of artificial hip joint implants. Both types of sputter etched surface structures were found to reduce the fatigue strength below that of smooth surface MP35N.

  19. Effects of Beam Filling Pattern on Beam Ion Instability and Beam Loading In PEP-X

    SciTech Connect

    Wang, L.; /SLAC

    2009-06-02

    A proposed high-brightness synchrotron light source (PEP-X) is under design at SLAC. The 4.5-GeV PEP-X storage ring has four theoretical minimum emittance (TME) cells to achieve the very low emittance and two double-bend achromat (DBA) cells to provide spaces for IDs. Damping wigglers will be installed in zero-dispersion straights to reduce the emittance below 0.1 nm. Ion induced beam instability is one critical issue due to its ultra small emittance. Third harmonic cavity can be used to lengthen the bunch in order to improve the beam's life time. Bunch-train filling pattern is proposed to mitigate both the fast ion instability and beam loading effect. This paper investigates the fast ion instability and beam loading for different beam filling patterns.

  20. Fibroblasts adhesion on ion beam modified polyethylene

    NASA Astrophysics Data System (ADS)

    Švorčík, V.; Tomášová, P.; Dvořánková, B.; Hnatowicz, V.; Ochsner, R.; Ryssel, H.

    2004-02-01

    Polyethylene (PE) was irradiated with 15 keV O +, P + and Ar + ions to the fluences from 3 × 10 12 to 1 × 10 15 cm -2. The changes of surface structure and polarity and oxygen concentration were examined on pristine and as-irradiated PE. The in vitro adhesion of rat 3T3 fibroblasts on the modified PE was evaluated 24 h after inoculation. Degradation of PE is manifested by the creation of conjugated double bonds and oxidation of the PE main chain. It was proved that the implanted P atoms are chemically bound onto degraded polymer chain. Wettability of the polymer surface is affected by the structure and composition of the modified surface layer. In comparison with pristine PE (i) higher cell adhesion is observed on implanted PE and (ii) the cells cultivated on implanted PE are larger and their adherence is significantly more homogeneous. The enhancement of 3T3 cells adhesion is highest and smallest for PE implanted with O + and Ar + ions, respectively. Highest cell adhesion was observed on PE implanted to the fluence of 1 × 10 13 cm -2 regardless of the ion specie. It was shown that the cell adhesion is related to the wettability of the PE surface and that there exists an optimal wettability with respect to the cell adhesion.

  1. Dispensing targets for ion beam particle generators

    NASA Technical Reports Server (NTRS)

    Miller, C. G. (Inventor)

    1974-01-01

    A target for dispensing high energy protons or neutrons or ionized atoms or ionized molecules is provided which comprises a container for the target gas, which is at atmospheric or higher pressure. The container material can release the target gas in the spot where the container is heated above a predetermined temperature by the impact of an ion beam where protons or neutrons are desired, or by electrons where ionized atoms or molecules are desired. On the outside of the container, except for the region where the beam is to impact, there is deposited a layer of a metal which is imperious to gaseous diffusion. A further protective coating of a material is placed over the layer of metal, except at the region of the ion impact area in order to adsorb any unreacted gas in the vacuum in which the target is placed, to thereby prevent reduction of the high vacuum, as well as contamination of the interior of the vacuum chamber.

  2. Ion-beam-assisted etching of diamond

    NASA Technical Reports Server (NTRS)

    Efremow, N. N.; Geis, M. W.; Flanders, D. C.; Lincoln, G. A.; Economou, N. P.

    1985-01-01

    The high thermal conductivity, low RF loss, and inertness of diamond make it useful in traveling wave tubes operating in excess of 500 GHz. Such use requires the controlled etching of type IIA diamond to produce grating like structures tens of micrometers deep. Previous work on reactive ion etching with O2 gave etching rates on the order of 20 nm/min and poor etch selectivity between the masking material (Ni or Cr) and the diamond. An alternative approach which uses a Xe(+) beam and a reactive gas flux of NO2 in an ion-beam-assisted etching system is reported. An etching rate of 200 nm/min was obtained with an etching rate ratio of 20 between the diamond and an aluminum mask.

  3. A high-current microwave ion source with permanent magnet and its beam emittance measurement

    SciTech Connect

    Yao Zeen; Tan Xinjian; Du Hongxin; Luo Ben; Liu Zhanwen

    2008-07-15

    The progress of a 2.45 GHz high-current microwave ion source with permanent magnet for T(d,n){sup 4}He reaction neutron generator is reported in this paper. At 600 W microwave power and 22 kV extraction voltage, 90 mA peak hydrogen ion beam is extracted from a single aperture of 6 mm diameter. The beam emittance is measured using a simplified pepper-pot method. The (x,x{sup '}) emittance and the (y,y{sup '}) emittance for 14 keV hydrogen ion beam are 55.3{pi} and 58.2{pi} mm mrad, respectively. The normalized emittances are 0.302{pi} and 0.317{pi} mm mrad, respectively.

  4. Channeling effect in polycrystalline deuterium-saturated CVD diamond target bombarded by deuterium ion beam

    NASA Astrophysics Data System (ADS)

    Bagulya, A. V.; Dalkarov, O. D.; Negodaev, M. A.; Rusetskii, A. S.; Chubenko, A. P.; Ralchenko, V. G.; Bolshakov, A. P.

    2015-07-01

    At the ion accelerator HELIS at LPI, the neutron yield is investigated in DD reactions within a strongly textured polycrystalline deuterium-saturated CVD diamond under irradiation by a deuterium ion beam with the energy of less than 30 keV. The measurements of the neutron flux in the beam direction are performed using a multichannel detector based on 3He counters, in dependence on the target angle, β, with respect to the beam axis. A significant anisotropy in the neutron yield is observed. At β = 0° the yield is higher by a factor of 3 as compared to that at β = ±45°. The possible reasons for the anisotropy, including ion channeling, are discussed.

  5. Operating characteristics of a new ion source for KSTAR neutral beam injection system

    NASA Astrophysics Data System (ADS)

    Kim, Tae-Seong; Jeong, Seung Ho; Chang, Doo-Hee; Lee, Kwang Won; In, Sang-Ryul

    2014-02-01

    A new positive ion source for the Korea Superconducting Tokamak Advanced Research neutral beam injection (KSTAR NBI-1) system was designed, fabricated, and assembled in 2011. The characteristics of the arc discharge and beam extraction were investigated using hydrogen and helium gas to find the optimum operating parameters of the arc power, filament voltage, gas pressure, extracting voltage, accelerating voltage, and decelerating voltage at the neutral beam test stand at the Korea Atomic Energy Research Institute in 2012. Based on the optimum operating condition, the new ion source was then conditioned, and performance tests were primarily finished. The accelerator system with enlarged apertures can extract a maximum 65 A ion beam with a beam energy of 100 keV. The arc efficiency and optimum beam perveance, at which the beam divergence is at a minimum, are estimated to be 1.0 A/kW and 2.5 uP, respectively. The beam extraction tests show that the design goal of delivering a 2 MW deuterium neutral beam into the KSTAR Tokamak plasma is achievable.

  6. Operating characteristics of a new ion source for KSTAR neutral beam injection system

    SciTech Connect

    Kim, Tae-Seong Jeong, Seung Ho; Chang, Doo-Hee; Lee, Kwang Won; In, Sang-Ryul

    2014-02-15

    A new positive ion source for the Korea Superconducting Tokamak Advanced Research neutral beam injection (KSTAR NBI-1) system was designed, fabricated, and assembled in 2011. The characteristics of the arc discharge and beam extraction were investigated using hydrogen and helium gas to find the optimum operating parameters of the arc power, filament voltage, gas pressure, extracting voltage, accelerating voltage, and decelerating voltage at the neutral beam test stand at the Korea Atomic Energy Research Institute in 2012. Based on the optimum operating condition, the new ion source was then conditioned, and performance tests were primarily finished. The accelerator system with enlarged apertures can extract a maximum 65 A ion beam with a beam energy of 100 keV. The arc efficiency and optimum beam perveance, at which the beam divergence is at a minimum, are estimated to be 1.0 A/kW and 2.5 uP, respectively. The beam extraction tests show that the design goal of delivering a 2 MW deuterium neutral beam into the KSTAR Tokamak plasma is achievable.

  7. Simulation of ion beam injection and extraction in an EBIS

    NASA Astrophysics Data System (ADS)

    Zhao, L.; Kim, J. S.

    2016-02-01

    An example simulation of Au+ charge breeding using FAR-TECH's integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.

  8. Measurement of ultra-low ion energy of decelerated ion beam using a deflecting electric field

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Suwannakachorn, D.; Tippawan, U.; Yu, L. D.

    2015-12-01

    In investigation on ultra-low-energy ion bombardment effect on DNA, an ion beam deceleration lens was developed for high-quality ultra-low-energy ion beam. Measurement of the ion energy after deceleration was necessary to confirm the ion beam really decelerated as theoretically predicted. In contrast to conventional methods, this work used a simple deflecting electrostatic field after the deceleration lens to bend the ion beam. The beam bending distance depended on the ion energy and was described and simulated. A system for the measurement of the ion beam energy was constructed. It consisted of a pair of parallel electrode plates to generate the deflecting electrical field, a copper rod measurement piece to detect ion beam current, a vernier caliper to mark the beam position, a stepping motor to translate the measurement rod, and a webcam-camera to read the beam bending distance. The entire system was installed after the ion-beam deceleration lens inside the large chamber of the bioengineering vertical ion beam line. Moving the measurement rod across the decelerated ion beam enabled to obtain beam profiles, from which the beam bending distance could be known and the ion beam energy could be calculated. The measurement results were in good agreement with theoretical and simulated results.

  9. Ion beam enhanced adhesion of iron films to sapphire substrates

    SciTech Connect

    Pawel, J.E.; Romana, L.J. ); McHargue, C.J. ); Wert, J.J. )

    1991-01-01

    The effect of implantation of different ion species on the adhesion of iron films to sapphire substrates has been investigated. The implantation energies were adjusted to ensure the ion concentration profiles, damage profiles, and recoil distributions were the same for each species. For all implantations, the peak ion concentration was at the film-substrate interface. The adhesion of the films was measured by pull test and a scratch test. For a fluence of 1 {times} 10{sup 15} ions-cm{sup {minus}2}, implantation of Cr (300 keV) and Fe (320 keV) increased the bond strength whereas implantation of Ni (340 keV) did not. The effect is proposed to be due to changes in the interfacial energy resulting from the presence of the ion species at the interface. Only a narrow zone is affected; the mixing at the interface is less than 10 nm. 24 refs., 3 figs.

  10. Beam Dynamics Considerations in Electron Ion Colliders

    NASA Astrophysics Data System (ADS)

    Krafft, Geoffrey

    2015-04-01

    The nuclear physics community is converging on the idea that the next large project after FRIB should be an electron-ion collider. Both Brookhaven National Lab and Thomas Jefferson National Accelerator Facility have developed accelerator designs, both of which need novel solutions to accelerator physics problems. In this talk we discuss some of the problems that must be solved and their solutions. Examples in novel beam optics systems, beam cooling, and beam polarization control will be presented. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. The U.S. Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce this manuscript for U.S. Government purposes.

  11. The XRS microcalorimeter spectrometer at the Livermore Electron Beam Ion Trap

    SciTech Connect

    Porter, F S; Beiersdorfer, P; Boyce, K; Brown, G V; Chen, H; Gygax, J; Kahn, S M; Kelley, R; Kilbourne, C A; Magee, E; Thorn, D B

    2007-08-22

    NASA's X-ray Spectrometer (XRS) microcalorimeter instrument has been operating at the Electron Beam Ion Trap (EBIT) facility at Lawrence Livermore National Laboratory since July of 2000. The spectrometer is currently undergoing its third major upgrade to become an easy to use, extremely high performance instrument for a broad range of EBIT experiments. The spectrometer itself is broadband, capable of simultaneously operating from 0.1 to 12 keV and has been operated at up to 100 keV by manipulating its operating conditions. The spectral resolution closely follows the spaceflight version of the XRS, beginning at 10 eV FWHM at 6 keV in 2000, upgraded to 5.5 eV in 2003, and will hopefully be {approx}3.8 eV in the Fall of 2007. Here we review the operating principles of this unique instrument, the extraordinary science that has been performed at EBIT over the last 6 years, and prospects for future upgrades. Specifically we discuss upgrades to cover the high-energy band (to at least 100 keV) with a high quantum efficiency detector, and prospects for using a new superconducting detector to reach 0.8 eV resolution at 1 keV, and 2 eV at 6 keV with high counting rates.

  12. Ion beam figuring of small optical components

    NASA Astrophysics Data System (ADS)

    Drueding, Thomas W.; Fawcett, Steven C.; Wilson, Scott R.; Bifano, Thomas G.

    1995-12-01

    Ion beam figuring provides a highly deterministic method for the final precision figuring of optical components with advantages over conventional methods. The process involves bombarding a component with a stable beam of accelerated particles that selectively removes material from the surface. Figure corrections are achieved by rastering the fixed-current beam across the workplace at appropriate, time-varying velocities. Unlike conventional methods, ion figuring is a noncontact technique and thus avoids such problems as edge rolloff effects, tool wear, and force loading of the workpiece. This work is directed toward the development of the precision ion machining system at NASA's Marshall Space Flight Center. This system is designed for processing small (approximately equals 10-cm diam) optical components. Initial experiments were successful in figuring 8-cm-diam fused silica and chemical-vapor-deposited SiC samples. The experiments, procedures, and results of figuring the sample workpieces to shallow spherical, parabolic (concave and convex), and non-axially-symmetric shapes are discussed. Several difficulties and limitations encountered with the current system are discussed. The use of a 1-cm aperture for making finer corrections on optical components is also reported.

  13. Development of a plasma generator for a long pulse ion source for neutral beam injectors

    NASA Astrophysics Data System (ADS)

    Watanabe, K.; Dairaku, M.; Tobari, H.; Kashiwagi, M.; Inoue, T.; Hanada, M.; Jeong, S. H.; Chang, D. H.; Kim, T. S.; Kim, B. R.; Seo, C. S.; Jin, J. T.; Lee, K. W.; In, S. R.; Oh, B. H.; Kim, J.; Bae, Y. S.

    2011-06-01

    A plasma generator for a long pulse H+/D+ ion source has been developed. The plasma generator was designed to produce 65 A H+/D+ beams at an energy of 120 keV from an ion extraction area of 12 cm in width and 45 cm in length. Configuration of the plasma generator is a multi-cusp bucket type with SmCo permanent magnets. Dimension of a plasma chamber is 25 cm in width, 59 cm in length, and 32.5 cm in depth. The plasma generator was designed and fabricated at Japan Atomic Energy Agency. Source plasma generation and beam extraction tests for hydrogen coupling with an accelerator of the KSTAR ion source have been performed at the KSTAR neutral beam test stand under the agreement of Japan-Korea collaborative experiment. Spatial uniformity of the source plasma at the extraction region was measured using Langmuir probes and ±7% of the deviation from an averaged ion saturation current density was obtained. A long pulse test of the plasma generation up to 200 s with an arc discharge power of 70 kW has been successfully demonstrated. The arc discharge power satisfies the requirement of the beam production for the KSTAR NBI. A 70 keV, 41 A, 5 s hydrogen ion beam has been extracted with a high arc efficiency of 0.9 -1.1 A/kW at a beam extraction experiment. A deuteron yield of 77% was measured even at a low beam current density of 73 mA/cm2.

  14. Development of a plasma generator for a long pulse ion source for neutral beam injectors

    SciTech Connect

    Watanabe, K.; Dairaku, M.; Tobari, H.; Kashiwagi, M.; Inoue, T.; Hanada, M.; Jeong, S. H.; Chang, D. H.; Kim, T. S.; Kim, B. R.; Seo, C. S.; Jin, J. T.; Lee, K. W.; In, S. R.; Oh, B. H.; Kim, J.; Bae, Y. S.

    2011-06-15

    A plasma generator for a long pulse H{sup +}/D{sup +} ion source has been developed. The plasma generator was designed to produce 65 A H{sup +}/D{sup +} beams at an energy of 120 keV from an ion extraction area of 12 cm in width and 45 cm in length. Configuration of the plasma generator is a multi-cusp bucket type with SmCo permanent magnets. Dimension of a plasma chamber is 25 cm in width, 59 cm in length, and 32.5 cm in depth. The plasma generator was designed and fabricated at Japan Atomic Energy Agency. Source plasma generation and beam extraction tests for hydrogen coupling with an accelerator of the KSTAR ion source have been performed at the KSTAR neutral beam test stand under the agreement of Japan-Korea collaborative experiment. Spatial uniformity of the source plasma at the extraction region was measured using Langmuir probes and {+-}7% of the deviation from an averaged ion saturation current density was obtained. A long pulse test of the plasma generation up to 200 s with an arc discharge power of 70 kW has been successfully demonstrated. The arc discharge power satisfies the requirement of the beam production for the KSTAR NBI. A 70 keV, 41 A, 5 s hydrogen ion beam has been extracted with a high arc efficiency of 0.9 -1.1 A/kW at a beam extraction experiment. A deuteron yield of 77% was measured even at a low beam current density of 73 mA/cm{sup 2}.

  15. Implantation-induced nonequilibrium reaction between Zn ions of 60 keV and SiO{sub 2} target

    SciTech Connect

    Amekura, H.; Yoshitake, M.; Plaksin, O. A.; Kishimoto, N.; Buchal, Ch.; Mantl, S.

    2007-08-06

    Silica glass (SiO{sub 2}) was implanted with 60 keV Zn{sup +} ions to a fluence of 1.0x10{sup 17} ions/cm{sup 2}, and the chemical states were investigated along the depth in as-implanted state by x-ray excited Auger electron spectroscopy and x-ray photoelectron spectroscopy. The metallic Zn and Zn{sub 2}SiO{sub 4} phases were found to have, respectively, formed in the shallow and deep regions of the SiO{sub 2}, whereas thermodynamics predicts the Zn phase only. Oxygen atoms in SiO{sub 2} are preferentially displaced to the deeper region because of the lighter mass. The excess oxygen in the deep region and athermal energy from the implantation drive the formation of Zn{sub 2}SiO{sub 4}.

  16. Homogeneous alignment of nematic liquid crystals by ion beam etched surfaces

    NASA Technical Reports Server (NTRS)

    Wintucky, E. G.; Mahmood, R.; Johnson, D. L.

    1979-01-01

    A wide range of ion beam etch parameters capable of producing uniform homogeneous alignment of nematic liquid crystals on SiO2 films are discussed. The alignment surfaces were generated by obliquely incident (angles of 5 to 25 deg) argon ions with energies in the range of 0.5 to 2.0 KeV, ion current densities of 0.1 to 0.6 mA sq cm and etch times of 1 to 9 min. A smaller range of ion beam parameters (2.0 KeV, 0.2 mA sq cm, 5 to 10 deg and 1 to 5 min.) were also investigated with ZrO2 films and found suitable for homogeneous alignment. Extinction ratios were very high (1000), twist angles were small ( or = 3 deg) and tilt-bias angles very small ( or = 1 deg). Preliminary scanning electron microscopy results indicate a parallel oriented surface structure on the ion beam etched surfaces which may determine alignment.

  17. Density effects on the guided transmission of 3 keV Ne 7+ ions through PET nanocapillaries

    NASA Astrophysics Data System (ADS)

    Stolterfoht, N.; Hellhammer, R.; Bundesmann, J.; Fink, D.

    2009-01-01

    Experiments for guided transmission of 3 keV Ne7+ ions through nanocapillaries in insulating PET polymers are reported. The ion guiding was studied for a two types of PET samples which consist of 200 nm capillaries with densities of 1 ×108cm-2 and 4 ×106cm-2 . The width of the emission profile and the fraction of transmitted ions were measured as a function of the capillary tilt angle. For the high capillary density the profile width of the transmitted ions is independent of the tilt angle in agreement previous studies. However, for the low-density sample the profile width was found to increase by a factor of 2 as the tilt angle increases from 0 ° to 8 ° . The results for the fraction of transmitted ions are used to evaluate the guiding angle, which specifies the guiding power of the material. The guiding powers were found to be equal for the two samples. The present results are discussed in terms of scaling laws, which have recently been established.

  18. Ion beam mixed oxidation protective coating on Zry-4 cladding

    NASA Astrophysics Data System (ADS)

    Park, Jae-Won; Kim, Jae-Un; Park, Jeong-Yong

    2016-06-01

    In this study, SiC was coated on the surface of Zry-4 cladding to improve the oxidation protectiveness. In the coating of SiC onto Zry-4, the prime concern was adhesion at an elevated temperature. Here, a 70 keV N ion beam was irradiated onto a SiC coating layer of ∼100 nm in thickness; this was deposited via the e-beam evaporation method. Additional coating to a target thickness was then carried out. The films deposited without ion-beam mixing (IBM) often peeled-off at an elevated temperature, while the IBM SiC film always adhered to Zry-4, even after heating to ∼1000 °C; at such a temperature, however, cracks formed in the film. X-ray photoelectron spectroscopy (XPS) analysis showed that the deposited SiC film contained about 20 at.% of O, while after annealing in air, 76 at.% of O was found on the surface layer. This implied that both the surface of SiC film and Zry-4 in the crack lines were oxidized. Comparing the Zr3d peak positions across the interface, a shift of binding energy by ∼1 eV was detected, representing that, in view of favorable thermodynamics, SiC/Zry-4 seems to be an acceptable system to apply IBM. To heal the crack, the process of IBM for a 1 μm thick coating and annealing was repeated. High-resolution field emission secondary electron microscopy (FE-SEM) showed that the crack lines, the main places at which oxidation occurred, were gradually covered as the process was repeated, ensuring enhanced oxidation protectiveness.

  19. Study of plasma confinement in ELMO Bumpy Torus with a heavy-ion beam probe

    SciTech Connect

    Bieniosek, F. M.

    1981-01-01

    Plasma confinement in ELMO Bumpy Torus (EBT) is generally strongly dependent on an ambipolar electric field. Spatially resolved measurements of the resulting electric space potential phi/sub sp/ have been made in a single plasma cross section by the heavy-ion beam probe. This diagnostic injects a 4-60-keV beam of (usually) Cs/sup +/ ions into the plasma. Measurement of the energy of Cs/sup 2 +/ secondary ions leaving the plasma gives a continuous monitor of the local space potential. In addition, the total detected Cs/sup 2 +/ ion current is proportional to the product of the local electron density and the ionization rate, which, in turn, is a function of the electron temperature. This signal, nf(T/sub e/), is sensitive to all three electron distributions found in EBT - those of the cold surface plasma, the warm core plasma, and the hot electron ring.

  20. Study on space charge compensation in negative hydrogen ion beam

    NASA Astrophysics Data System (ADS)

    Zhang, A. L.; Peng, S. X.; Ren, H. T.; Zhang, T.; Zhang, J. F.; Xu, Y.; Guo, Z. Y.; Chen, J. E.

    2016-02-01

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H+ beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H- beam from a 2.45 GHz microwave driven H- ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results.

  1. Study on space charge compensation in negative hydrogen ion beam.

    PubMed

    Zhang, A L; Peng, S X; Ren, H T; Zhang, T; Zhang, J F; Xu, Y; Guo, Z Y; Chen, J E

    2016-02-01

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H(+) beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H(-) beam from a 2.45 GHz microwave driven H(-) ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results. PMID:26932087

  2. Glancing-angle ion enhanced surface diffusion on gaAs(001) during molecular beam epitaxy.

    PubMed

    DeLuca, P M; Ruthe, K C; Barnett, S A

    2001-01-01

    We describe the effects of glancing incidence 3-4 keV Ar ion bombardment on homoepitaxial growth on vicinal GaAs(001). The average adatom lifetime on surface terraces, measured during growth using specular ion scattering, decreased monotonically with increasing ion current density. The results indicated that surface diffusivity was increased by the ions. The ion beam also suppressed growth oscillations and decreased the film surface roughness. This indicates a change from two-dimensional island nucleation to step-flow growth due to increased adatom surface diffusivity. A simple model, involving direct momentum transfer from ions to adatoms, is shown to be consistent with the measured enhanced diffusion. PMID:11177806

  3. Development of the Holifield Radioactive Ion Beam Facility

    SciTech Connect

    Tatum, B.A.

    1997-08-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) construction project has been completed and the first radioactive ion beam has been successfully accelerated. The project, which began in 1992, has involved numerous facility modifications. The Oak Ridge Isochronous Cyclotron has been converted from an energy booster for heavy ion beams to a light ion accelerator with internal ion source. A target-ion source and mass analysis system have been commissioned as key components of the facility`s radioactive ion beam injector to the 25MV tandem electrostatic accelerator. Beam transport lines have been completed, and new diagnostics for very low intensity beams have been developed. Work continues on a unified control system. Development of research quality radioactive beams for the nuclear structure and nuclear astrophysics communities continues. This paper details facility development to date.

  4. Radioactive Ion Beam Production Capabilities At The Holifield Radioactive Ion Beam Facility

    NASA Astrophysics Data System (ADS)

    Beene, J. R.; Dowling, D. T.; Gross, C. J.; Juras, R. C.; Liu, Y.; Meigs, M. J.; Mendez, A. J.; Nazarewicz, W.; Sinclair, J. W.; Stracener, D. W.; Tatum, B. A.

    2011-06-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) is a national user facility for research with radioactive ion beams (RIBs) that has been in routine operation since 1996. It is located at Oak Ridge National Laboratory (ORNL) and operated by the ORNL Physics Division. The principal mission of the HRIBF is the production of high quality beams of shortlived radioactive isotopes to support research in nuclear structure physics and nuclear astrophysics. HRIBF is currently unique worldwide in its ability to provide neutron-rich fission fragment beams post-accelerated to energies above the Coulomb barrier for nuclear reactions. HRIBF produces RIBs by the isotope separator on-line (ISOL) technique using a particle accelerator system that consists of the Oak Ridge Isochronous Cyclotron (ORIC) driver accelerator, one of the two Injectors for Radioactive Ion Species (IRIS1 or IRIS2) production systems, and the 25-MV tandem electrostatic accelerator that is used for RIB post-acceleration. ORIC provides a light ion beam (proton, deuteron, or alpha) which is directed onto a thick target mounted in a target-ion source (TIS) assembly located on IRIS1 or IRIS2. Radioactive atoms that diffuse from the target material are ionized, accelerated, mass selected, and transported to the tandem accelerator where they are further accelerated to energies suitable for nuclear physics research. RIBs are transported through a beam line system to various experimental end stations including the Recoil Mass Spectrometer (RMS) for nuclear structure research, and the Daresbury Recoil Separator (DRS) for nuclear astrophysics research. HRIBF also includes two off-line ion source test facilities, one low-power on-line ISOL test facility (OLTF), and one high-power on-line ISOL test facility (HPTL). This paper provides an overview and status update of HRIBF, describes the recently completed 4.7M IRIS2 addition and incorporation of laser systems for beam production and purification, and discusses a

  5. A pepper-pot emittance meter for low-energy heavy-ion beams

    SciTech Connect

    Kremers, H. R.; Beijers, J. P. M.; Brandenburg, S.

    2013-02-15

    A novel emittance meter has been developed to measure the four-dimensional, transverse phase-space distribution of a low-energy ion beam using the pepper-pot technique. A characteristic feature of this instrument is that the pepper-pot plate, which has a linear array of holes in the vertical direction, is scanned horizontally through the ion beam. This has the advantage that the emittance can also be measured at locations along the beam line where the beam has a large horizontal divergence. A set of multi-channel plates, scintillation screen, and ccd camera is used as a position-sensitive ion detector allowing a large range of beam intensities that can be handled. This paper describes the design, construction, and operation of the instrument as well as the data analysis used to reconstruct the four-dimensional phase-space distribution of an ion beam. Measurements on a 15 keV He{sup +} beam are used as an example.

  6. High-energy accelerator for beams of heavy ions

    DOEpatents

    Martin, Ronald L.; Arnold, Richard C.

    1978-01-01

    An apparatus for accelerating heavy ions to high energies and directing the accelerated ions at a target comprises a source of singly ionized heavy ions of an element or compound of greater than 100 atomic mass units, means for accelerating the heavy ions, a storage ring for accumulating the accelerated heavy ions and switching means for switching the heavy ions from the storage ring to strike a target substantially simultaneously from a plurality of directions. In a particular embodiment the heavy ion that is accelerated is singly ionized hydrogen iodide. After acceleration, if the beam is of molecular ions, the ions are dissociated to leave an accelerated singly ionized atomic ion in a beam. Extraction of the beam may be accomplished by stripping all the electrons from the atomic ion to switch the beam from the storage ring by bending it in magnetic field of the storage ring.

  7. Study on Defects in H+ion Implanted B2 type Fe-Al Alloy using Slow Positron Beam

    NASA Astrophysics Data System (ADS)

    Komagata, S.; Kawasuso, A.; Yabuuchi, A.; Maekawa, M.; Batchulun, C.; Yasuda, K.; Ishigami, R.; Kume, K.; Iwase, A.; Hori, F.

    Fe48-at.%Al alloy were implanted with 50 keV H+ ions to the fluence of 3×1016 and 1×1018/cm2 at room temperature. Positron annihilation Doppler broadening and lifetime measurements for these alloys have been carried out using slow positron beam apparatus with an energy range of 0.2 to 30.2 keV. The positron annihilation S-parameter decreased by H+ ion irradiation. Also the positron lifetimes for hydrogen deposited region in the alloy decreased by the irradiation. These results show that implanted H atoms were trapped by vacancy type defects.

  8. Calculations of Neutral Beam Ion Confinement for the National Spherical Torus Experiment

    SciTech Connect

    M.H. Redi; D.S. Darrow; J. Egedal; S.M. Kaye; R.B. White

    2002-06-27

    The spherical torus (ST) concept underlies several contemporary plasma physics experiments, in which relatively low magnetic fields, high plasma edge q, and low aspect ratio combine for potentially compact, high beta and high performance fusion reactors. An important issue for the ST is the calculation of energetic ion confinement, as large Larmor radius makes conventional guiding center codes of limited usefulness and efficient plasma heating by RF and neutral beam ion technology requires minimal fast ion losses. The National Spherical Torus Experiment (NSTX) is a medium-sized, low aspect ratio ST, with R=0.85 m, a=0.67 m, R/a=1.26, Ip*1.4 MA, Bt*0.6 T, 5 MW of neutral beam heating and 6 MW of RF heating. 80 keV neutral beam ions at tangency radii of 0.5, 0.6 and 0.7 m are routinely used to achieve plasma betas above 30%. Transport analyses for experiments on NSTX often exhibit a puzzling ion power balance. It will be necessary to have reliable beam ion calculations to distinguish among the source and loss channels, and to explore the possibilities for new physics phenomena, such as the recently proposed compressional Alfven eigenmode ion heating.

  9. Post-acceleration of laser-induced ion beams

    NASA Astrophysics Data System (ADS)

    Nassisi, V.; Delle Side, D.

    2015-04-01

    A complete review of the essential and recent developments in the field of post-acceleration of laser-induced ion beams is presented. After a brief introduction to the physics of low-intensity nanosecond laser-matter interaction, the details of ions extraction and acceleration are critically analyzed and the key parameters to obtain good-quality ion beams are illustrated. A description of the most common ion beam diagnosis system is given, together with the associated analytical techniques.

  10. Persistent ion beam induced conductivity in zinc oxide nanowires

    SciTech Connect

    Johannes, Andreas; Niepelt, Raphael; Gnauck, Martin; Ronning, Carsten

    2011-12-19

    We report persistently increased conduction in ZnO nanowires irradiated by ion beam with various ion energies and species. This effect is shown to be related to the already known persistent photo conduction in ZnO and dubbed persistent ion beam induced conduction. Both effects show similar excitation efficiency, decay rates, and chemical sensitivity. Persistent ion beam induced conduction will potentially allow countable (i.e., single dopant) implantation in ZnO nanostructures and other materials showing persistent photo conduction.

  11. Energy deposition of H and He ion beams in hydroxyapatite films: A study with implications for ion-beam cancer therapy

    NASA Astrophysics Data System (ADS)

    Limandri, Silvina; de Vera, Pablo; Fadanelli, Raul C.; Nagamine, Luiz C. C. M.; Mello, Alexandre; Garcia-Molina, Rafael; Behar, Moni; Abril, Isabel

    2014-02-01

    Ion-beam cancer therapy is a promising technique to treat deep-seated tumors; however, for an accurate treatment planning, the energy deposition by the ions must be well known both in soft and hard human tissues. Although the energy loss of ions in water and other organic and biological materials is fairly well known, scarce information is available for the hard tissues (i.e., bone), for which the current stopping power information relies on the application of simple additivity rules to atomic data. Especially, more knowledge is needed for the main constituent of human bone, calcium hydroxyapatite (HAp), which constitutes 58% of its mass composition. In this work the energy loss of H and He ion beams in HAp films has been obtained experimentally. The experiments have been performed using the Rutherford backscattering technique in an energy range of 450-2000 keV for H and 400-5000 keV for He ions. These measurements are used as a benchmark for theoretical calculations (stopping power and mean excitation energy) based on the dielectric formalism together with the MELF-GOS (Mermin energy loss function-generalized oscillator strength) method to describe the electronic excitation spectrum of HAp. The stopping power calculations are in good agreement with the experiments. Even though these experimental data are obtained for low projectile energies compared with the ones used in hadron therapy, they validate the mean excitation energy obtained theoretically, which is the fundamental quantity to accurately assess energy deposition and depth-dose curves of ion beams at clinically relevant high energies. The effect of the mean excitation energy choice on the depth-dose profile is discussed on the basis of detailed simulations. Finally, implications of the present work on the energy loss of charged particles in human cortical bone are remarked.

  12. Ion beam mixing of metal/fluoropolymer interfaces

    SciTech Connect

    Dennis, D. L.; Giedd, R. E.; Wang, Y. Q.; Glass, G. A.

    1999-06-10

    Ion beam mixing of metals and polymers with very low dielectric constants such as Teflon can provide many applications in the area of electronic materials. This work is a study of the 'mixing' effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene) substrates. RBS analysis shows that the distribution of thin layers of copper and chromium (approximately 300-400 A thick) through the implant layer of the Teflon depends on the reactivity of the metal. As the implant fluence is increased, the distribution of metal atoms in the polymer matrix becomes concentrated over smaller ranges near the bottom of the implant layer. In situ RGA analysis during the implantation shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA experiment that shows the non-uniform concentration profile of fluorine throughout the implant layer. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer making a smooth transition to the undamaged bulk Teflon below. Low dielectric materials with highly conductive surfaces, such as this one, may provide an opportunity for a broad range of new microelectronic applications.

  13. Ion beam mixing of metal/fluoropolymer interfaces

    SciTech Connect

    Dennis, D.L.; Giedd, R.E.; Wang, Y.Q.; Glass, G.A.

    1999-06-01

    Ion beam mixing of metals and polymers with very low dielectric constants such as Teflon can provide many applications in the area of electronic materials. This work is a study of the {open_quotes}mixing{close_quotes} effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene) substrates. RBS analysis shows that the distribution of thin layers of copper and chromium (approximately 300-400 {Angstrom} thick) through the implant layer of the Teflon depends on the reactivity of the metal. As the implant fluence is increased, the distribution of metal atoms in the polymer matrix becomes concentrated over smaller ranges near the bottom of the implant layer. {ital In situ} RGA analysis during the implantation shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA experiment that shows the non-uniform concentration profile of fluorine throughout the implant layer. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer making a smooth transition to the undamaged bulk Teflon below. Low dielectric materials with highly conductive surfaces, such as this one, may provide an opportunity for a broad range of new microelectronic applications. {copyright} {ital 1999 American Institute of Physics.}

  14. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons

    NASA Astrophysics Data System (ADS)

    Zheng, Yi; Sanche, Léon

    2010-10-01

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV (˜4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons.

  15. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons

    SciTech Connect

    Zheng Yi; Sanche, Leon

    2010-10-21

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV ({approx}4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons.

  16. Patient position verification in ion-beam therapy using ion-beam radiography and fiducial markers

    NASA Astrophysics Data System (ADS)

    Huber, Lucas; Telsemeyer, Julia; Martišíková, Mária; Jäkel, Oliver

    2011-11-01

    The basic rationale for radiation therapy using ion-beams is its high local precision of dose deposition. Therefore accurate patient positioning prior to and during beam application is a crucial part of the therapy. The current standard position verification procedure uses X-ray based imaging before each beam application. The patient is assumed to remain in his position throughout irradiation. Currently there is no monitoring of the patient position or organ movement during treatment. The aim of this study is to investigate the possibility of verifying the position of a fiducial marker during therapy using ion radiography. Some modern ion therapy facilities like the Heidelberg Ion-Beam Therapy Center (HIT), where our measurements were carried out, use scanning pencil beams to apply dose. Exploiting them for imaging allows to solely irradiate regions of interest in the patient's body, e.g. tissue containing medical markers. The advantage of this technique is that it can be performed quickly in turn with therapeutic beam application and irradiates only very little tissue. For our measurements we used conventional medical metal markers embedded in phantom material mimicking body tissue. To image the residual beam we use a Perkin Elmer RID256-L flat panel detector. In an idealized setup the marker contrast was measured to be as high as 60%, which was reduced by a factor of 2-2.5 when the marker was placed at distances to the detector in the phantom material larger than 10 cm. It was shown that applying 2ṡ105 carbon ions suffices to make the markers' position visible in a setup of realistic material thickness and marker depth. While the dose is comparable to X-ray imaging, the irradiated volume and, consequently, also the integral dose is considerably reduced. However, in realistic geometries there are large particle range differences in lateral direction yielding steep signal gradients in the radiography. Thus, the useful image area with unambiguous signal

  17. Electron beam diagnostic for space charge measurement of an ion beam

    SciTech Connect

    Roy, Prabir K.; Yu, Simon S.; Henestroza, Enrique; Eylon, Shmuel; Shuman, Derek B.; Ludvig, Jozsef; Bieniosek, Frank M.; Waldron, William L.; Greenway, Wayne G.; Vanecek, David L.; Hannink, Ryan; Amezcua, Monserrat

    2004-09-25

    A non-perturbing electron beam diagnostic system for measuring the charge distribution of an ion beam is developed for Heavy Ion Fusion (HIF) beam physics studies. Conventional diagnostics require temporary insertion of sensors into the beam, but such diagnostics stop the beam, or significantly alter its properties. In this diagnostic a low energy, low current electron beam is swept transversely across the ion beam; the measured electron beam deflection is used to infer the charge density profile of the ion beam. The initial application of this diagnostic is to the Neutralized Transport Experiment (NTX), which is exploring the physics of space-charge-dominated beam focusing onto a small spot using a neutralizing plasma. Design and development of this diagnostic and performance with the NTX ion beamline is presented.

  18. Transferring Gus gene into intact rice cells by low energy ion beam

    NASA Astrophysics Data System (ADS)

    Zengliang, Yu; Jianbo, Yang; Yuejin, Wu; Beijiu, Cheng; Jianjun, He; Yuping, Huo

    1993-06-01

    A new technique of transferring genes by low energy ion beam has been reported in this paper. The Gus and CAT (chloramphenicol acetyltransferase) genes, as "foreign" genetic materials, were introduced into the suspension cells and ripe embryos or rice by implantation of 20-30 keV Ar + at doses ranging from 1 × 10 15 to 4 × 10 15 ions/cm 2. The activities of CAT and Gus were detected in the cells and embryos after several weeks. The results indicate that the transfer was a success.

  19. Amorphization of In/Au-bilayers by low temperature ion beam mixing

    NASA Astrophysics Data System (ADS)

    Miehle, W.; Plewnia, A.; Ziemann, P.

    1993-06-01

    Au/In-bilayers with a thickness ratio corresponding to AuIn 2 have been bombarded at different temperatures TS < 15, 77, 125 and 180 K with 350 keV Kr +-ions. The resulting ion beam mixing (IM) is monitored by in situ resistance measurements. At TS ≤ 125 K, IM leads to the formation of an amorphous phase, while at TS = 180 K the disordered crystalline AuIn 2-phase is obtained. The mixing efficiencies extracted from the sputter-corrected resistance data are found to be temperature-independent for TS ≤ 180 K and are consistent with the predictions of the thermal spike model.

  20. Fragmentation of H2O by 1 -- 5 keV He^2+ ions: Experiment and Theory

    NASA Astrophysics Data System (ADS)

    Stolterfoht, N.; Hellhammer, R.; Sobocinski, P.; Cabrera-Trujillo, R.; Ohrn, Y.; Deumens, E.; Sabin, J.

    2006-05-01

    Fragmentation of H2O molecules induced by ^3He^2+ impact was investigated experimentally as a function of the energy in the range from 1-5 keV. Collisions at large impact parameters are found to produce fragment protons with energies centered around peaks at 6 eV and 15 eV. The H^+ fragments were detected in the angular range from 25 to 135 with respect to the incident beam direction. Absolute fragmentation cross sections dσ/dφ, differential in the emission angle are found to be anisotropic, with protons preferentially emitted at angles near 90 . In addition to the experiments, we performed quantum-mechanical calculations to understand the fragmentation mechanisms producing protons at preferred energies and angles. The theoretical results are obtained using the Electron-Nuclear Dynamics formalism (END), which solves the time-dependent Schr"odinger equation.

  1. Morphological change of self-organized protrusions of fluoropolymer surface by ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Kitamura (Ogawa), Akane; Kobayashi, Tomohiro; Satoh, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Suzuki, Akihiro; Terai, Takayuki

    2013-07-01

    Polytetrafluoroethylene (PTFE) and fluorinated ethylene propylene (FEP) are typical fluoropolymers displaying several desirable technological properties such as electrical insulation and high chemical resistance. When their surfaces are irradiated with ion beams, dense micro-protrusions formed after the emergence and spread of micropores across the entire irradiated area, allowing culture cells to spread on the top of the protrusions. In this study, we investigate the morphological changes introduced in the fluoropolymer surfaces by ion beams as the energy of the beams is increased. When an FEP sample was irradiated with a nitrogen ion beam with an energy of less than 350 keV at 1.0 μA/cm2, protrusions were formed with a density between 2 × 107/cm2 and 2 × 108/cm2. However, at energies higher than 350 keV, the protrusions became sparse, and the density dropped to 5 × 102/cm2. Protrusions appeared sporadically during irradiation at high energies, and the top of the protrusions appeared as spots inside the sample, which were difficult to etch and became elongated as the erosion of the surface progressed. Erosion was caused by sputtering of FEP molecules and evaporation at notably elevated temperatures on the surface. Analysis based on attenuated total reflectance/Fourier transform infrared spectroscopy showed the presence of Cdbnd C bonds as well as -COOH, -Cdbnd O, and -OH bonds on all irradiated samples. Their concentration on the surface densely covered with micro-protrusions was higher than that on the surface with sparse protrusions after irradiation at energies exceeding 350 keV. Thus, we determined a suitable range for the ion energy for creating FEP surfaces densely covered with protrusions.

  2. The Neutralization of Ion-Rocket Beams

    NASA Technical Reports Server (NTRS)

    Kaufman, Harold R.

    1961-01-01

    The experimental ion-beam behavior obtained without neutralizers is compared with both simple collision theory and plasma-wave theory. This comparison indicates that plasma waves play an important part in beam behavior, although the present state of plasma-wave theory does not permit more than a qualitative comparison. The theories of immersed-emitter and electron-trap neutralizer operation are discussed; and, to the extent permitted by experimental data, the theory is compared with experimental results. Experimental data are lacking completely at the present time for operation in space. The results that might be expected in space and the means of simulating such operation in Earth-bound facilities, however, are discussed.

  3. Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection

    NASA Astrophysics Data System (ADS)

    Patterson, N.; Adams, D. P.; Hodges, V. C.; Vasile, M. J.; Michael, J. R.; Kotula, P. G.

    2008-06-01

    We report a direct, ion drilling technique that enables the reproducible fabrication and placement of nanopores in membranes of different thickness. Using a 30 keV focused Ga ion beam column combined with an in situ, back face, multi-channelplate particle detector, nanopores are sputtered in Si3N4 and W/Si3N4 to have diameters as small as 12 nm. Transmission electron microscopy shows that focused ion beam-drilled holes are near-conical with the diameter decreasing from entry to exit side. By monitoring the detector signal during ion exposure, the drilled hole width can be minimized such that the exit-side diameter is smaller than the full width at half-maximum of the nominally Gaussian-shaped incident beam. Judicious choice of the beam defining aperture combined with back face particle detection allows for reproducible exit-side hole diameters between 18 and 100 nm. The nanopore direct drilling technique does not require potentially damaging broad area exposure to tailor hole sizes. Moreover, this technique successfully achieves breakthrough despite the effects of varying membrane thickness, redeposition, polycrystalline grain structure, and slight ion beam current fluctuations.

  4. Modeling of a multicharged ion beam line using SIMION

    NASA Astrophysics Data System (ADS)

    Korwin-Pawlowski, Michael L.; Amiz, Karima; Elsayed-Ali, Hani

    2009-06-01

    Multicharged ion beams (MCI) are promising tools to probe or modify the surface of materials with applications in microelectronics and nanotechnology. Ion beam lines are parts of the MCI systems connecting the ion source with the processing chamber and they perform the function of extracting, accelerating, decelerating, focusing and scanning the ion beam on the surface of the target. In our work we present results of modeling of an MCI beam line using the SIMION code to simulate the flight of ions, with the purpose of optimizing the yield of the line and avoiding spurious effects due to interaction of the ions with the metallic elements of the line, such as heating, outgassing and excessive Xray emission. We show that a two stage ion extractor could significantly reduce ion beam losses.

  5. University of Wisconsin Ion Beam Laboratory: A facility for irradiated materials and ion beam analysis

    SciTech Connect

    Field, K. G.; Wetteland, C. J.; Cao, G.; Maier, B. R.; Gerczak, T. J.; Kriewaldt, K.; Sridharan, K.; Allen, T. R.; Dickerson, C.; Field, C. R.

    2013-04-19

    The University of Wisconsin Ion Beam Laboratory (UW-IBL) has recently undergone significant infrastructure upgrades to facilitate graduate level research in irradiated materials phenomena and ion beam analysis. A National Electrostatics Corp. (NEC) Torodial Volume Ion Source (TORVIS), the keystone upgrade for the facility, can produce currents of hydrogen ions and helium ions up to {approx}200 {mu}A and {approx}5 {mu}A, respectively. Recent upgrades also include RBS analysis packages, end station developments for irradiation of relevant material systems, and the development of an in-house touch screen based graphical user interface for ion beam monitoring. Key research facilitated by these upgrades includes irradiation of nuclear fuels, studies of interfacial phenomena under irradiation, and clustering dynamics of irradiated oxide dispersion strengthened steels. The UW-IBL has also partnered with the Advanced Test Reactor National Scientific User Facility (ATR-NSUF) to provide access to the irradiation facilities housed at the UW-IBL as well as access to post irradiation facilities housed at the UW Characterization Laboratory for Irradiated Materials (CLIM) and other ATR-NSUF partner facilities. Partnering allows for rapid turnaround from proposed research to finalized results through the ATR-NSUF rapid turnaround proposal system. An overview of the UW-IBL including CLIM and relevant research is summarized.

  6. A negative ion beam application to artificial formation of neuron network in culture

    NASA Astrophysics Data System (ADS)

    Tsuji, Hiroshi; Sato, Hiroko; Baba, Takahiro; Gotoh, Yasuhito; Ishikawa, Junzo

    2000-02-01

    A negative ion beam modification of the biocompatibility of polystyrene surface was investigated for the artificial formation of neuron network in culture with respect to negative ion species. Negative ions of silver, copper or carbon were implanted in nontreated polystyrene (NTPS) dishes at conditions of 20 keV and 3×1015ions/cm2 through a mask with many slits of 60 μm in width. For the surface wettability, the contact angle of ion-implanted NTPS was about 75° for silver-negative ions, which was lower than 86° of the original NTPS. For carbon implantation, on the contrary, the contact angles did not change from the original value. In culture experiment using neuron cells of PC-12h (rat adrenal pheochromocytoma), the cells cultured with serum medium in two days showed the cell attachment and growth in number only at the ion-implanted region on NTPS for all ion species. In another two days in culture with nonserum medium including a nerve growth factor, the outgrowth of neural protrusions was also observed only at the ion-implanted region for all ion species. There was a difference in number of attached cells for ion species. The silver-negative ion-implanted NTPS had a large effect for cell attachment compared with other two ion species. This reason is considered to be due to the lowest contract angles among them.

  7. Studies on space charge neutralization and emittance measurement of beam from microwave ion source.

    PubMed

    Misra, Anuraag; Goswami, A; Sing Babu, P; Srivastava, S; Pandit, V S

    2015-11-01

    A 2.45 GHz microwave ion source together with a beam transport system has been developed at VECC to study the problems related with the injection of high current beam into a compact cyclotron. This paper presents the results of beam profile measurement of high current proton beam at different degrees of space charge neutralisation with the introduction of neon gas in the beam line using a fine leak valve. The beam profiles have been measured at different pressures in the beam line by capturing the residual gas fluorescence using a CCD camera. It has been found that with space charge compensation at the present current level (∼5 mA at 75 keV), it is possible to reduce the beam spot size by ∼34%. We have measured the variation of beam profile as a function of the current in the solenoid magnet under the neutralised condition and used these data to estimate the rms emittance of the beam. Simulations performed using equivalent Kapchinsky-Vladimirsky beam envelope equations with space charge neutralization factor are also presented to interpret the experimental results. PMID:26628123

  8. Studies on space charge neutralization and emittance measurement of beam from microwave ion source

    SciTech Connect

    Misra, Anuraag; Goswami, A.; Sing Babu, P.; Srivastava, S.; Pandit, V. S. E-mail: vspandit12@gmail.com

    2015-11-15

    A 2.45 GHz microwave ion source together with a beam transport system has been developed at VECC to study the problems related with the injection of high current beam into a compact cyclotron. This paper presents the results of beam profile measurement of high current proton beam at different degrees of space charge neutralisation with the introduction of neon gas in the beam line using a fine leak valve. The beam profiles have been measured at different pressures in the beam line by capturing the residual gas fluorescence using a CCD camera. It has been found that with space charge compensation at the present current level (∼5 mA at 75 keV), it is possible to reduce the beam spot size by ∼34%. We have measured the variation of beam profile as a function of the current in the solenoid magnet under the neutralised condition and used these data to estimate the rms emittance of the beam. Simulations performed using equivalent Kapchinsky-Vladimirsky beam envelope equations with space charge neutralization factor are also presented to interpret the experimental results.

  9. Development of a focused ion beam micromachining system

    SciTech Connect

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  10. Focused ion beam in dental research.

    PubMed

    Ngo, H; Cairney, J; Munroe, P; Vargas, M; Mount, G

    2000-11-01

    Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been confined to the semiconductor industry. It has been developed as an important tool in defect analysis, circuit modification and recently transmission electron microscope sample preparation. This paper introduces FIB and demonstrates its application in dental research. Its ion and electron imaging modes complement the SEM while its ability to prepare TEM samples from a wide range of material will allow the study of new types of adhesive interface. As an example, its use is described in the characterization of the interface of resin to a tribochemically treated surface of an experimental fiber-reinforced resin-based composite. As with all new techniques, the initial learning curve was difficult to manage. This new instrument offers opportunities to expand research in dental materials to areas not possible before. PMID:11763915

  11. High fluence ion beam modification of polymer surfaces: EPR and XPS studies

    NASA Astrophysics Data System (ADS)

    Popok, V. N.; Azarko, I. I.; Odzhaev, V. B.; Tóth, A.; Khaibullin, R. I.

    2001-05-01

    Polyethylene, polyamide-6 and polyimide foils implanted with 100 keV B+, P+ and Sb + ions to a fluence range of 10 15-10 17 cm-2 have been studied using the electron paramagnetic resonance (EPR) and X-ray photoelectron spectroscopy (XPS) methods. The experimental data allow the comparison of the implantation-induced changes both in a given polymer foil under different ion beam regimes and in different polymers under similar ion-bombardment conditions. The high fluence implantation of boron ions, depositing energy mainly via electronic stopping, was found to be accompanied with the effective formation of π-bonded carbon-rich clusters. By contrast, heavier (phosphorus and antimony) ions, which deposit energy predominantly in nuclear collisions, produced a lower concentration of π-radicals and a less carbonised top surface layer. The peculiarities and main trends of the alterations of the polymer structure and composition induced via electronic and nuclear stopping have also been discussed.

  12. Micromilling of Metal Alloys with Focused Ion Beam-Fabricated Tools

    SciTech Connect

    ADAMS,DAVID P.; VASILE,M.J.; BENAVIDES,GILBERT L.; CAMPBELL,ANN N.

    1999-11-05

    This work combines focused ion beam sputtering and ultra-precision machining as a first step in fabricating microstructure in metals and alloys. Specifically, {approx}25{micro}m diameter micro-end mills are made from cobalt M42 high-speed steel and C2 micrograin tungsten carbide tool blanks by ion beam sputtering. A 20 keV focused gallium beam defines tool cutting edges having radii of curvature < 0.1{micro}m. Micro-end mills having 2, 4 and 5 cutting edges successfully machine small trenches in 6061-T4 aluminum, brass, 4340 steel and polymethyl methacrylate. Machined trench widths are approximately equal to the tool diameters and surface roughnesses (rms) are {approx}150 nm or less. Microtools are robust and operate for more than 6 hours without fracture. Results from ultra-precision machining aluminum at feed rates as high as 50 mm/minute are included.

  13. Formation of plasma and ion flux on a target, irradiated by an intense electron beam

    SciTech Connect

    Engelko, Vladimir; Mueller, Georg

    2005-07-01

    Theoretical consideration shows that under the influence of an intense electron beam, first, an ion flux and then plasma are formed on the surface of a target. The target plasma is created when the density of the ion flux achieves a certain limiting value. The time necessary for the plasma formation depends on the beam current density and the efficiency of gas desorption and ionization. This time is few microseconds under typical vacuum conditions of about 5.0x10{sup -5} mbar, electron-beam current density in the range of 10 A/cm{sup 2}, and kinetic energy of electrons in the range of 100 keV. When the density of the ion flux reaches a limiting value the beam potential decreases to a level, which is half of the initial one. A transient layer is formed between the plasma boundary and the electron beam. For conditions mentioned above its length are few centimeters. The target plasma expands into the beam drift region, with a velocity increasing in time. The expansion of the target plasma is the main reason for neutralization of the electron-beam space charge.

  14. Relevance of surface viscous flow, surface diffusion, and ballistic effects in keV ion smoothing of amorphous surfaces

    SciTech Connect

    Vauth, Sebastian; Mayr, S. G.

    2007-06-01

    Surface viscous flow, surface diffusion, and ballistic effects have recently been discussed as possible atomic-scale mechanisms to explain the dramatic smoothing reactions observed during keV ion bombardment of amorphous surfaces. By employing multiscale modeling, viz. a combination of molecular dynamics and continuum rate equations, we compare the relevance of the individual processes at room temperature. This is achieved by calculating diffusion constants, viscosities, and lateral transport due to momentum transfer. Depending on the surface structure size, we find the dominance of surface viscous flow or ballistic effects. The findings are found to be valid for both strong and fragile glasses, as represented by amorphous Si and CuTi, respectively.

  15. The electrical properties of 60 keV zinc ions implanted into semi-insulating gallium arsenide

    NASA Technical Reports Server (NTRS)

    Littlejohn, M. A.; Anikara, R.

    1972-01-01

    The electrical behavior of zinc ions implanted into chromium-doped semiinsulating gallium arsenide was investigated by measurements of the sheet resistivity and Hall effect. Room temperature implantations were performed using fluence values from 10 to the 12th to 10 to the 15th power/sq cm at 60 keV. The samples were annealed for 30 minutes in a nitrogen atmosphere up to 800 C in steps of 200 C and the effect of this annealing on the Hall effect and sheet resistivity was studied at room temperature using the Van der Pauw technique. The temperature dependence of sheet resistivity and mobility was measured from liquid nitrogen temperature to room temperature. Finally, a measurement of the implanted profile was obtained using a layer removal technique combined with the Hall effect and sheet resistivity measurements.

  16. Formation of carbon nanoclusters by implantation of keV carbon ions in fused silica followed by thermal annealing

    NASA Astrophysics Data System (ADS)

    Olivero, P.; Peng, J. L.; Liu, A.; Reichart, P.; McCallum, J. C.; Sze, J. Y.; Lau, S. P.; Tay, B. K.; Kalish, R.; Dhar, S.; Feldman, Leonard; Jamieson, David N.; Prawer, Steven

    2005-02-01

    In the last decade, the synthesis and characterization of nanometer sized carbon clusters have attracted growing interest within the scientific community. This is due to both scientific interest in the process of diamond nucleation and growth, and to the promising technological applications in nanoelectronics and quantum communications and computing. Our research group has demonstrated that MeV carbon ion implantation in fused silica followed by thermal annealing in the presence of hydrogen leads to the formation of nanocrystalline diamond, with cluster size ranging from 5 to 40 nm. In the present paper, we report the synthesis of carbon nanoclusters by the implantation into fused silica of keV carbon ions using the Plasma Immersion Ion Implantation (PIII) technique, followed by thermal annealing in forming gas (4% 2H in Ar). The present study is aimed at evaluating this implantation technique that has the advantage of allowing high fluence-rates on large substrates. The carbon nanostructures have been characterized with optical absorption and Raman spectroscopies, cross sectional Transmission Electron Microscopy (TEM), and Parallel Electron Energy Loss Spectroscopy (PEELS). Nuclear Reaction Analysis (NRA) has been employed to evaluate the deuterium incorporation during the annealing process, as a key mechanism to stabilize the formation of the clusters.

  17. Operation of a 0.2-1.1 keV ion source within a magnetized laboratory plasma

    NASA Astrophysics Data System (ADS)

    Boehmer, H.; Edrich, D.; Heidbrink, W. W.; McWilliams, R.; Zhao, L.; Leneman, D.

    2004-04-01

    To study the physics of energetic ions in magnetized plasma, a rf ion beam is inserted into the 1 kG, ˜3 eV, ˜1012 cm-3 plasma produced by the upgraded LArge Plasma Device (LAPD). The commercial 100-1000 eV argon source normally operates in an unmagnetized microelectronics production environment. Successful operation in the LAPD requires numerous modifications, including electrical isolation of the source housing, relocation of the matching network for the rf, reduction of the gas pressure, pulsed operation to avoid overheating, and care to preserve current neutralization in the presence of a strong magnetic field. With these modifications, a ˜500 eV, milliampere beam that propagates axially more than 6 m is obtained.

  18. Low energy oxygen ion beam modification of the surface morphology and chemical structure of polyurethane fibers

    NASA Astrophysics Data System (ADS)

    Wong, K. H.; Zinke-Allmang, M.; Wan, W. K.; Zhang, J. Z.; Hu, P.

    2006-01-01

    Energetic O+ ions were implanted into polyurethane (PU) fiber filaments, at 60 and 100 keV with doses of 5 × 1014 and 1 × 1015 ions/cm2, to modify the near-surface fiber morphology. The implantations were performed at room temperature and at -197 °C, a temperature well below the glass transition temperature for this system. At room temperature, the lower energy implantation heats the fibers primarily near their surface, causing the fiber surface to smoothen and to develop a flattened shape. At the higher energy, the ion beam deposits its energy closer to the fiber core, heating the fiber more uniformly and causing them to re-solidify slowly. This favors a cylindrical equilibrium shape with a smooth fiber surface and no crack lines. The average fiber diameter reduced during 100 keV implantation from 3.1 to 2.3 μm. At -197 °C, the ion implantation does not provide enough heat to cause notable physical modifications, but the fibers crack and break during subsequent warming to room temperature. The dose dependence of the crack formation along the fiber intersections is presented. The ion beams further cause near-surface chemical modifications in the fibers, particularly introducing two new chemical functional groups (C-(Cdbnd O)-C and C-N-C).

  19. The ReA electron-beam ion trap charge breeder for reacceleration of rare isotopes

    SciTech Connect

    Lapierre, A.; Schwarz, S.; Kittimanapun, K.; Fogleman, J.; Krause, S.; Nash, S.; Rencsok, R.; Tobos, L.; Perdikakis, G.; Portillo, M.; Rodriguez, J. A.; Wittmer, W.; Wu, X.; Bollen, G.; Leitner, D.; Syphers, M.; Collaboration: ReA Team

    2013-04-19

    ReA is a post-accelerator at the National Superconducting Cyclotron Laboratory at Michigan State University. ReA is designed to reaccelerate rare isotopes to energies of a few MeV/u following production by projectile fragmentation and thermalization in a gas cell. The facility consists of four main components: an electron-beam ion trap (EBIT) charge breeder, an achromatic charge-over-mass (Q/A) separator, a radio-frequency quadrupole accelerator, and a superconducting radio-frequency linear accelerator. The EBIT charge breeder was specifically designed to efficiently capture continuous beams of singly charged ions injected at low energy (<60 keV), charge breed in less than 50 ms, and extract highly charged ions to the Q/A separator for charge-state selection and reacceleration through the accelerator structures. The use of highly charged ions to reach high beam energies is a key aspect that makes ReA a compact and cost-efficient post-accelerator. The EBIT is characterized by a high-current electron gun, a long multi-electrode trap structure and a dual magnet to provide both the high electron-beam current density necessary for fast charge breeding of short-lived isotopes as well as the high capture probability of injected beams. This paper presents an overview and the status of the ReA EBIT, which has extracted for reacceleration tests stable {sup 20}Ne{sup 8+} ion beams produced from injected gas and more recently {sup 39}K{sup 16+} beams by injecting stable {sup 39,41}K{sup +} ions from an external ion source.

  20. The ReA electron-beam ion trap charge breeder for reacceleration of rare isotopes

    NASA Astrophysics Data System (ADS)

    Lapierre, A.; Schwarz, S.; Kittimanapun, K.; Fogleman, J.; Krause, S.; Nash, S.; Rencsok, R.; Tobos, L.; Perdikakis, G.; Portillo, M.; Rodriguez, J. A.; Wittmer, W.; Wu, X.; Bollen, G.; Leitner, D.; Syphers, M.; ReA Team

    2013-04-01

    ReA is a post-accelerator at the National Superconducting Cyclotron Laboratory at Michigan State University. ReA is designed to reaccelerate rare isotopes to energies of a few MeV/u following production by projectile fragmentation and thermalization in a gas cell. The facility consists of four main components: an electron-beam ion trap (EBIT) charge breeder, an achromatic charge-over-mass (Q/A) separator, a radio-frequency quadrupole accelerator, and a superconducting radio-frequency linear accelerator. The EBIT charge breeder was specifically designed to efficiently capture continuous beams of singly charged ions injected at low energy (<60 keV), charge breed in less than 50 ms, and extract highly charged ions to the Q/A separator for charge-state selection and reacceleration through the accelerator structures. The use of highly charged ions to reach high beam energies is a key aspect that makes ReA a compact and cost-efficient post-accelerator. The EBIT is characterized by a high-current electron gun, a long multi-electrode trap structure and a dual magnet to provide both the high electron-beam current density necessary for fast charge breeding of short-lived isotopes as well as the high capture probability of injected beams. This paper presents an overview and the status of the ReA EBIT, which has extracted for reacceleration tests stable 20Ne8+ ion beams produced from injected gas and more recently 39K16+ beams by injecting stable 39,41K+ ions from an external ion source.

  1. Positive and negative ion beam merging system for neutral beam production

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani

    2005-12-13

    The positive and negative ion beam merging system extracts positive and negative ions of the same species and of the same energy from two separate ion sources. The positive and negative ions from both sources pass through a bending magnetic field region between the pole faces of an electromagnet. Since the positive and negative ions come from mirror image positions on opposite sides of a beam axis, and the positive and negative ions are identical, the trajectories will be symmetrical and the positive and negative ion beams will merge into a single neutral beam as they leave the pole face of the electromagnet. The ion sources are preferably multicusp plasma ion sources. The ion sources may include a multi-aperture extraction system for increasing ion current from the sources.

  2. Low temperature Ti-Si-C thin film deposition by ion beam assisted methods

    NASA Astrophysics Data System (ADS)

    Twardowska, Agnieszka; Rajchel, Boguslaw; Jaworska, Lucyna

    2010-11-01

    Thin, multiphase Ti-Si-C coatings were formed by IBSD or by IBAD methods on AISI 316L steel substrates in room temperature, using single Ti3SiC2 target. In those methods the TiXSiCY coatings were formed from the flux of energetic atoms and ions obtained by ion sputtering of the Ti3SiC2 compound sample. As sputtering beam the beam of Ar+ ions at energy of 15keV was applied. In the IBAD method the dynamically formed coatings were additionally bombarded by beam of Ar+ ions at energy of 15keV. The ion beams parameters were obtained by using Monte Carlo computer simulations. The morphology (SEM, TEM), chemical (EDS/EDX) and phase composition (XRD) examinations of formed coatings were provided as well as confocal Raman microspectroscopy. Analyzed coatings were relatively thin (150nm-1μm), flat and dense. XRD analysis indicated in amorphous TiSi, the traces of Ti5Si3 and other phases from Ti-Si-C system (TiSi, TiSi2,Ti3SiC2). For chemical bonds investigation, the laser beam with length of 532nm was used. Those analyses were performed in the low (LR) or in high (HR) resolution modes in room temperature and in 4000C. In the HR mode the spectral resolution was close to 2 cm-1. In Raman spectra peaks at: 152cm-1, 216cm-1, 278cm-1, 311 cm-1, 608cm-1, 691cm-1 were recorded. Nanoindentation tests were done on coated and uncoated substrates with diamond, Berkovich-type indenter. Vickers hardness HIT and reduced elastic modulus EIT were calculated using Olivier& Pharr method. HIT for coated substrates was in the range 2.7 to 5.3 GPa, EIT was 160 GPa.

  3. Long pulse acceleration of MeV class high power density negative H- ion beam for ITER

    NASA Astrophysics Data System (ADS)

    Umeda, N.; Kojima, A.; Kashiwagi, M.; Tobari, H.; Hiratsuka, J.; Watanabe, K.; Dairaku, M.; Yamanaka, H.; Hanada, M.

    2015-04-01

    R&D of high power density negative ion beam acceleration has been carried out at MeV test facility in JAEA to realize ITER neutral beam accelerator. The main target is H- ion beam acceleration up to 1 MeV with 200 A/m2 for 60 s whose pulse length is the present facility limit. For long pulse acceleration at high power density, new extraction grid (EXG) has been developed with high cooling capability, which electron suppression magnet is placed under cooling channel similar to ITER. In addition, aperture size of electron suppression grid (ESG) is enlarged from 14 mm to 16 mm to reduce direct interception on the ESG and emission of secondary electron which leads to high heat load on the upstream acceleration grid. By enlarging ESG aperture, beam current increased 10 % at high current beam and total acceleration grid heat load reduced from 13 % to 10 % of input power at long pulse beam. In addition, heat load by back stream positive ion into the EXG is measured for the first time and is estimated as 0.3 % of beam power, while heat load by back stream ion into the source chamber is estimated as 3.5 ~ 4.0 % of beam power. Beam acceleration up to 60 s which is the facility limit, has achieved at 683 keV, 100 A/m2 of negative ion beam, whose energy density increases two orders of magnitude since 2011.

  4. Long pulse acceleration of MeV class high power density negative H{sup −} ion beam for ITER

    SciTech Connect

    Umeda, N. Kojima, A.; Kashiwagi, M.; Tobari, H.; Hiratsuka, J.; Watanabe, K.; Dairaku, M.; Yamanaka, H.; Hanada, M.

    2015-04-08

    R and D of high power density negative ion beam acceleration has been carried out at MeV test facility in JAEA to realize ITER neutral beam accelerator. The main target is H{sup −} ion beam acceleration up to 1 MeV with 200 A/m{sup 2} for 60 s whose pulse length is the present facility limit. For long pulse acceleration at high power density, new extraction grid (EXG) has been developed with high cooling capability, which electron suppression magnet is placed under cooling channel similar to ITER. In addition, aperture size of electron suppression grid (ESG) is enlarged from 14 mm to 16 mm to reduce direct interception on the ESG and emission of secondary electron which leads to high heat load on the upstream acceleration grid. By enlarging ESG aperture, beam current increased 10 % at high current beam and total acceleration grid heat load reduced from 13 % to 10 % of input power at long pulse beam. In addition, heat load by back stream positive ion into the EXG is measured for the first time and is estimated as 0.3 % of beam power, while heat load by back stream ion into the source chamber is estimated as 3.5 ~ 4.0 % of beam power. Beam acceleration up to 60 s which is the facility limit, has achieved at 683 keV, 100 A/m{sup 2} of negative ion beam, whose energy density increases two orders of magnitude since 2011.

  5. Ion beam probing of electrostatic fields

    NASA Technical Reports Server (NTRS)

    Persson, H.

    1979-01-01

    The determination of a cylindrically symmetric, time-independent electrostatic potential V in a magnetic field B with the same symmetry by measurements of the deflection of a primary beam of ions is analyzed and substantiated by examples. Special attention is given to the requirements on canonical angular momentum and total energy set by an arbitrary, nonmonotone V, to scaling laws obtained by normalization, and to the analogy with ionospheric sounding. The inversion procedure with the Abel analysis of an equivalent problem with a one-dimensional fictitious potential is used in a numerical experiment with application to the NASA Lewis Modified Penning Discharge. The determination of V from a study of secondary beams of ions with increased charge produced by hot plasma electrons is also analyzed, both from a general point of view and with application to the NASA Lewis SUMMA experiment. Simple formulas and geometrical constructions are given for the minimum energy necessary to reach the axis, the whole plasma, and any point in the magnetic field. The common, simplifying assumption that V is a small perturbation is critically and constructively analyzed; an iteration scheme for successively correcting the orbits and points of ionization for the electrostatic potential is suggested.

  6. Effects of evolving surface morphology on yield during focused ion beam milling of carbon.

    SciTech Connect

    Mayer, Thomas Michael; Adams, David Price; Archuleta, Kim M.; Vasile, Michael J.

    2005-07-01

    We investigate evolving surface morphology during focused ion beam bombardment of C and determine its effects on sputter yield over a large range of ion dose (10{sup 17}-10{sup 19} ions/cm{sup 2}) and incidence angles ({Theta} = 0-80{sup o}). Carbon bombarded by 20 keV Ga{sup +} either retains a smooth sputtered surface or develops one of two rough surface morphologies (sinusoidal ripples or steps/terraces) depending on the angle of ion incidence. For conditions that lead to smooth sputter-eroded surfaces there is no change in yield with ion dose after erosion of the solid commences. However, for all conditions that lead to surface roughening we observe coarsening of morphology with increased ion dose and a concomitant decrease in yield. A decrease in yield occurs as surface ripples increase wavelength and, for large {Theta}, as step/terrace morphologies evolve. The yield also decreases with dose as rippled surfaces transition to have steps and terraces at {Theta} = 75{sup o}. Similar trends of decreasing yield are found for H{sub 2}O-assisted focused ion beam milling. The effects of changing surface morphology on yield are explained by the varying incidence angles exposed to the high-energy beam.

  7. Progress and future developments of high current ion source for neutral beam injector in the ASIPP

    SciTech Connect

    Hu, Chundong; Xie, Yahong Xie, Yuanlai; Liu, Sheng; Liu, Zhimin; Xu, Yongjian; Liang, Lizhen; Sheng, Peng; Jiang, Caichao

    2015-04-08

    A high current hot cathode bucket ion source, which based on the US long pulse ion source is developed in Institute of Plasma Physics, Chinese Academy of Sciences. The ion source consists of a bucket plasma generator with multi-pole cusp fields and a set of tetrode accelerator with slit apertures. So far, four ion sources are developed and conditioned on the ion source test bed. 4 MW hydrogen beam with beam energy of 80 keV is extracted. In Aug. 2013, EAST NBI 1 with two ion source installed on the EAST, and achieved H-mode plasma with NBI injection for the first time. In order to achieve stable long pulse operation of high current ion source and negative ion source research, the RF ion source with 200 mm diameter and 120 mm depth driver is designed and developed. The first RF plasma generated with 2 kW power of 1 MHz frequency. More of the RF plasma tests and negative source relative research need to do in the future.

  8. Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam

    SciTech Connect

    Yamamoto, Y.; Ichiki, K.; Ninomiya, S.; Matsuo, J.; Seki, T.; Aoki, T.

    2011-01-07

    The sputtering yields of organic materials under large cluster ion bombardment are much higher than those under conventional monomer ion bombardment. The sputtering rate of arginine remains constant with fluence for an Ar cluster ion beam, but decreases with fluence for Ar monomer. Additionally, because Ar cluster etching induces little damage, Ar cluster ion can be used to achieve molecular depth profiling of organic materials. In this study, we evaluated the damage to poly methyl methacrylate (PMMA) and arginine samples irradiated with Ar atomic and Ar cluster ion beams. Arginine samples were analyzed by secondary ion mass spectrometry (SIMS) and PMMA samples were analyzed by X-ray photoelectron spectroscopy (XPS). The chemical structure of organic materials remained unchanged after Ar cluster irradiation, but was seriously damaged. These results indicated that bombardment with Ar cluster ions induced less surface damage than bombardment with Ar atomic ion. The damage layer thickness with 5 keV Ar cluster ion bombardment was less than 1 nm.

  9. Ion beam requirements for fast ignition of inertial fusion targets

    SciTech Connect

    Honrubia, J. J.; Murakami, M.

    2015-01-15

    Ion beam requirements for fast ignition are investigated by numerical simulation taking into account new effects, such as ion beam divergence, not included before. We assume that ions are generated by the TNSA scheme in a curved foil placed inside a re-entrant cone and focused on the cone apex or beyond. From the focusing point to the compressed core, ions propagate with a given divergence angle. Ignition energies are obtained for two compressed fuel configurations heated by proton and carbon ion beams. The dependence of the ignition energies on the beam divergence angle and on the position of the ion beam focusing point has been analyzed. Comparison between TNSA and quasi-monoenergetic ions is also shown.

  10. Resonant excitation of waves by a spiraling ion beam on the large plasma device

    NASA Astrophysics Data System (ADS)

    Tripathi, Shreekrishna

    2015-11-01

    The resonant interaction between energetic-ions and plasma waves is a fundamental topic of importance in the space, controlled magnetic-fusion, and laboratory plasma physics. We report new results on the spontaneous generation of traveling shear Alfvén waves and high-harmonic beam-modes in the lower-hybrid range of frequencies by an intense ion beam. In particular, the role of Landau and Doppler-shifted ion-cyclotron resonances (DICR) in extracting the free-energy from the ion-beam and destabilizing Alfvén waves was explored on the Large Plasma Device (LAPD). In these experiments, single and dual-species magnetized plasmas (n ~1010 -1012 cm-3, Te ~ 5.0-10.0 eV, B = 0.6-1.8 kG, He+ and H+ ions, 19.0 m long, 0.6 m diameter) were produced and a spiraling hydrogen ion beam (5-15 keV, 2-10 A, beam-speed/Alfvén-speed = 0.2-1.5, J ~ 50-150 mA/cm2, pitch-angle ~53°) was injected into the plasma. The interaction of the beam with the plasma was diagnosed using a retarding-field energy analyzer, three-axis magnetic-loop, and Langmuir probes. The resonance conditions for the growth of shear Alfvén waves were examined by varying the parameters of the ion-beam and ambient plasma. The experimental results demonstrate that the DICR process is particularly effective in exciting left-handed polarized shear Alfvén waves that propagate in the direction opposite to the ion beam. The high-harmonic beam modes were detected in the vicinity of the spiraling ion beam and contained more than 80 harmonics of Doppler-shifted gyro-frequency of the beam. Work jointly supported by US DOE and NSF and performed at the Basic Plasma Science Facility, UCLA.

  11. The prospects of a subnanometer focused neon ion beam.

    PubMed

    Rahman, F H M; McVey, Shawn; Farkas, Louis; Notte, John A; Tan, Shida; Livengood, Richard H

    2012-01-01

    The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress. PMID:21796647

  12. Performance and Controllability of Pulsed Ion Beam Ablation Propulsion

    SciTech Connect

    Yazawa, Masaru; Buttapeng, Chainarong; Harada, Nobuhiro; Suematsu, Hisayuki; Jiang Weihua; Yatsui, Kiyoshi

    2006-05-02

    We propose novel propulsion driven by ablation plasma pressures produced by the irradiation of pulsed ion beams onto a propellant. The ion beam ablation propulsion demonstrates by a thin foil (50 {mu}mt), and the flyer velocity of 7.7 km/s at the ion beam energy density of 2 kJ/cm2 adopted by using the Time-of-flight method is observed numerically and experimentally. We estimate the performance of the ion beam ablation propulsion as specific impulse of 3600 s and impulse bit density of 1700 Ns/m2 obtained from the demonstration results. In the numerical analysis, a one-dimensional hydrodynamic model with ion beam energy depositions is used. The control of the ion beam kinetic energy is only improvement of the performance but also propellant consumption. The spacecraft driven by the ion beam ablation provides high performance efficiency with short-pulsed ion beam irradiation. The numerical results of the advanced model explained latent heat and real gas equation of state agreed well with experimental ones over a wide range of the incident ion beam energy density.

  13. Spacecraft charging during ion beam emissions in sunlight

    NASA Technical Reports Server (NTRS)

    Lai, S. T.; Mcneil, W. J.; Aggson, T. L.

    1990-01-01

    During ion beam emissions from the SCATHA satellite, the potential of the negatively charged satellite body shows a sinusoidal oscillation frequency of once-per-spin of the satellite. The minimum occurs when the ion beam is sunward. The processes that may be responsible for the voltage modulation are considered. Neutralization of ion beam space charge by photoelectrons is examined. The photoelectrons are accelerated by the negative potential of the satellite. Effects of electron impact ionization, excitation of metastable states, and photoionization of xenon neutral atoms in the ion beam are studied in detail. Critical ionization velocity interaction is unlikely under the condition considered.

  14. DEVELOPMENT OF EMITTANCE ANALYSIS SOFTWARE FOR ION BEAM CHARACTERIZATION

    SciTech Connect

    Padilla, M. J.; Liu, Y.

    2007-01-01

    Transverse beam emittance is a crucial property of charged particle beams that describes their angular and spatial spread. It is a fi gure of merit frequently used to determine the quality of ion beams, the compatibility of an ion beam with a given beam transport system, and the ability to suppress neighboring isotopes at on-line mass separator facilities. Generally a high quality beam is characterized by a small emittance. In order to determine and improve the quality of ion beams used at the Holifi eld Radioactive Ion beam Facility (HRIBF) for nuclear physics and nuclear astrophysics research, the emittances of the ion beams are measured at the off-line Ion Source Test Facilities. In this project, emittance analysis software was developed to perform various data processing tasks for noise reduction, to evaluate root-mean-square emittance, Twiss parameters, and area emittance of different beam fractions. The software also provides 2D and 3D graphical views of the emittance data, beam profi les, emittance contours, and RMS. Noise exclusion is essential for accurate determination of beam emittance values. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is employed. Numerical data analysis techniques such as interpolation and nonlinear fi tting are also incorporated into the software. The software will provide a simplifi ed, fast tool for comprehensive emittance analysis. The main functions of the software package have been completed. In preliminary tests with experimental emittance data, the analysis results using the software were shown to be accurate.

  15. Testing Time Dilation on Fast Ion Beams

    NASA Astrophysics Data System (ADS)

    Saathoff, G.; Reinhardt, S.; Bernhardt, B.; Holzwarth, R.; Udem, T.; Hänsch, T. W.; Bing, D.; Schwalm, D.; Wolf, A.; Botermann, B.; Karpuk, S.; Novotny, C.; Nörtershäuser, W.; Huber, G.; Geppert, C.; Kühl, T.; Stöhlker, T.; Rempel, T.; Gwinner, G.

    2011-12-01

    We report the status of an experimental test of special-relativistic time dilation. Following an idea of Ives and Stilwell in 1938, we measure the forward and backward Doppler shifts of an electronic transition of fast moving ions, using high-precision laser spectroscopy. From these Doppler shifts both the ion velocity β = υ/c and the time dilation factor γ = γ {SR} (1 + hat α β 2 ) can be derived for testing Special Relativity. From measurements based on saturation spectroscopy on lithium ions stored at β = 0.03 and β = 0.06, we achieved an upper limit for deviation from Special Relativity of <=ft| {hat α } ; | \\underline < 8 × 10{ - 8} . Recent measurements on a β = 0.338 Li+ beam show similar sensitivity and promise an improvement by at least one order of magnitude. Finally we discuss present sensitivities to various coefficients in the photon and particle sector of the Standard-Model Extension, as well as possible modifications of the experiment for the test of further, hitherto unbounded, coefficients.

  16. Microdosimetry in ion-beam therapy

    NASA Astrophysics Data System (ADS)

    Magrin, Giulio; Mayer, Ramona

    2015-05-01

    The information of the dose is not sufficiently describing the biological effects of ions on tissue since it does not express the radiation quality, i.e. the heterogeneity of the processes due to the slowing-down and the fragmentation of the particles when crossing a target. Depending on different circumstances, the radiation quality can be determined using measurements, calculations, or simulations. Microdosimeters are the primary tools used to provide the experimental information of the radiation quality and their role is becoming crucial for the recent clinical developments in particular with carbon ion therapy. Microdosimetry is strongly linked to the biological effectiveness of the radiation since it provides the physical parameters which explicitly distinguish the radiation for its capability of damaging cells. In the framework of ion-beam therapy microdosimetry can be used in the preparation of the treatment to complement radiobiological experiments and to analyze the modification of the radiation quality in phantoms. A more ambitious goal is to perform the measurements during the irradiation procedure to determine the non-targeted radiation and, more importantly, to monitor the modification of the radiation quality inside the patient. These procedures provide the feedback of the treatment directly beneficial for the single patient but also for the characterization of the biological effectiveness in general with advantages for all future treatment. Traditional and innovative tools are currently under study and an outlook of present experience and future development is presented here.

  17. Comparative Dosimetric Estimates of a 25 keV Electron Micro-beam with three Monte Carlo Codes

    SciTech Connect

    Mainardi, Enrico; Donahue, Richard J.; Blakely, Eleanor A.

    2002-09-11

    The calculations presented compare the different performances of the three Monte Carlo codes PENELOPE-1999, MCNP-4C and PITS, for the evaluation of Dose profiles from a 25 keV electron micro-beam traversing individual cells. The overall model of a cell is a water cylinder equivalent for the three codes but with a different internal scoring geometry: hollow cylinders for PENELOPE and MCNP, whereas spheres are used for the PITS code. A cylindrical cell geometry with scoring volumes with the shape of hollow cylinders was initially selected for PENELOPE and MCNP because of its superior simulation of the actual shape and dimensions of a cell and for its improved computer-time efficiency if compared to spherical internal volumes. Some of the transfer points and energy transfer that constitute a radiation track may actually fall in the space between spheres, that would be outside the spherical scoring volume. This internal geometry, along with the PENELOPE algorithm, drastically reduced the computer time when using this code if comparing with event-by-event Monte Carlo codes like PITS. This preliminary work has been important to address dosimetric estimates at low electron energies. It demonstrates that codes like PENELOPE can be used for Dose evaluation, even with such small geometries and energies involved, which are far below the normal use for which the code was created. Further work (initiated in Summer 2002) is still needed however, to create a user-code for PENELOPE that allows uniform comparison of exact cell geometries, integral volumes and also microdosimetric scoring quantities, a field where track-structure codes like PITS, written for this purpose, are believed to be superior.

  18. The response of a fast phosphor screen scintillator (ZnO:Ga) to low energy ions (0-60 keV)

    SciTech Connect

    Jimenez-Rey, D.; Rodriguez-Barquero, L.

    2010-10-15

    ZnO:Ga is a promising, high time resolution candidate for use as a fast-ion-loss detector in TJ-II. We compare its ionoluminescence with that of the standard fast-ion-loss detector material, SrGa{sub 2}S{sub 4}:Eu (also known as TG-Green), when irradiated by H{sup +} ions with a range of energies E{<=}60 keV using a dedicated laboratory setup. It is found that ZnO:Ga is a reasonably good candidate for detecting low energy (E<60 keV) ions as it has excellent time resolution; however, its sensitivity is about 100 times lower than TG-Green, potentially limiting it to applications with high energy ion loss signals.

  19. Inactivation of Human Cells by Heavy-ion Beams and Microdosimetric Estimates

    NASA Astrophysics Data System (ADS)

    Kase, Y.; Kanai, T.; Matsumoto, Y.; Furusawa, Y.; Sakama, M.; Asaba, T.

    In the field of heavy-ion therapy and space radiation protection the prediction of biological effects of heavy charged particles is an important problem In microdosimetry tissue-equivalent proportional counter TEPC has been often used to estimate the biological effect of ionizing radiations We measured the radiation quality of various ion beams using a spherical TEPC while the inactivation of in vitro human cells was investigated by colony assay The ion beams were provided by the Heavy-ion Medical Accelerator HIMAC in Chiba NIRS Japan The microdosimetric spectra of photon and proton- helium- carbon- neon- silicon- and iron-ions LET range from 0 5 to 880 keV micron were measured using a spherical walled TEPC with a tissue-equivalent diameter of 1 micron at various depths in a plastic phantom In the measurement of cell surviving curves human salivary grand HSG tumor cells were used as a human tumor cell line and GM05389 cells were used as a normal human fibroblast cell line The linear terms of linear quadratic model with a fixed quadratic term for surviving curves of each cell types were plotted as a function of the dose-mean lineal energy measured by the TEPC We found that these plots agreed with the microdosimetric kinetic MK model R B Hawkins 1994 for ion beams with a LET value of less than 450 keV micron as long as the saturation-corrected dose-mean lineal energy was used instead of dose-mean lineal energy with non-Poisson correction in the MK model Therefore in heavy ion therapy this microdosimetric estimate of the revised MK

  20. A new luminescence beam profile monitor for intense proton and heavy ion beams

    SciTech Connect

    Tsang,T.; Bellavia, S.; Connolly, R.; Gassner, D.; Makdisi, Y.; Russo, T.; Thieberger, P.; Trbojevic, D.; Zelenski, A.

    2008-10-01

    A new luminescence beam profile monitor is realized in the polarized hydrogen gas jet target at the Relativistic Heavy Ion Collider (RHIC) facility. In addition to the spin polarization of the proton beam being routinely measured by the hydrogen gas jet, the luminescence produced by beam-hydrogen excitation leads to a strong Balmer series lines emission. A selected hydrogen Balmer line is spectrally filtered and imaged to produce the transverse RHIC proton beam shape with unprecedented details on the RHIC beam profile. Alternatively, when the passage of the high energy RHIC gold ion beam excited only the residual gas molecules in the beam path, sufficient ion beam induced luminescence is produced and the transverse gold ion beam profile is obtained. The measured transverse beam sizes and the calculated emittances provide an independent confirmation of the RHIC beam characteristics and to verify the emittance conservation along the RHIC accelerator. This optical beam diagnostic technique by making use of the beam induced fluorescence from injected or residual gas offers a truly noninvasive particle beam characterization, and provides a visual observation of proton and heavy ion beams. Combined with a longitudinal bunch measurement system, a 3-dimensional spatial particle beam profile can be reconstructed tomographically.

  1. Laser cooling of relativistic heavy-ion beams for FAIR

    NASA Astrophysics Data System (ADS)

    Winters, D.; Beck, T.; Birkl, G.; Dimopoulou, C.; Hannen, V.; Kühl, Th; Lochmann, M.; Loeser, M.; Ma, X.; Nolden, F.; Nörtershäuser, W.; Rein, B.; Sánchez, R.; Schramm, U.; Siebold, M.; Spiller, P.; Steck, M.; Stöhlker, Th; Ullmann, J.; Walther, Th; Wen, W.; Yang, J.; Zhang, D.; Bussmann, M.

    2015-11-01

    Laser cooling is a powerful technique to reduce the longitudinal momentum spread of stored relativistic ion beams. Based on successful experiments at the experimental storage ring at GSI in Darmstadt, of which we show some important results in this paper, we present our plans for laser cooling of relativistic ion beams in the future heavy-ion synchrotron SIS100 at the Facility for Antiproton and Ion Research in Darmstadt.

  2. ITEP MEVVA ion beam for rhenium silicide production

    SciTech Connect

    Kulevoy, T.; Seleznev, D.; Kropachev, G.; Kozlov, A.; Kuibeda, R.; Yakushin, P.; Petrenko, S.; Gerasimenko, N.; Medetov, N.; Zaporozhan, O.

    2010-02-15

    The rhenium silicides are very attractive materials for semiconductor industry. In the Institute for Theoretical and Experimental Physics (ITEP) at the ion source test bench the research program of rhenium silicide production by ion beam implantation are going on. The investigation of silicon wafer after implantation of rhenium ion beam with different energy and with different total dose were carried out by secondary ions mass spectrometry, energy-dispersive x-ray microanalysis, and x-ray diffraction analysis. The first promising results of rhenium silicide film production by high intensity ion beam implantation are presented.

  3. New method of beam bunching in free-ion lasers

    SciTech Connect

    Bessonov, E.G.

    1995-12-31

    An effective ion beam bunching method is suggested. This method is based on a selective interaction of line spectrum laser light (e.g. axial mode structure light) with non-fully stripped ion beam cooled in a storage rings, arranging the ion beam in layers in radial direction of an energy-longitudinal coordinate plane and following rotation of the beam at the right angle after switching on the RF cavity or undulator grouper/buncher. Laser cooling of the ion beam can be used at this position after switching off the resonator to decrease the energy spread caused by accelerating field of the resonator. A relativistic multilayer ion mirror will be produced this way. Both monochromatic laser beams and intermediate monochromaticity and bandwidth light sources of spontaneous incoherent radiation can be used for production of hard and high power electromagnetic radiation by reflection from this mirror. The reflectivity of the mirror is rather high because of the cross-section of the backward Rayleigh scattering of photon light by non-fully stripped relativistic ions ({approximately}{lambda}{sup 2}) is much greater ({approximately} 10{divided_by}15 orders) then Thompson one ({approximately} r{sub e}{sup 2}). This position is valid even in the case of non-monochromatic laser light ({Delta}{omega}/{omega} {approximately} 10{sup -4}). Ion cooling both in longitudinal plane and three-dimensional radiation ion cooling had been proposed based on this observation. The using of these cooling techniques will permit to store high current and low emittance relativistic ion beams in storage rings. The bunched ion beam can be used in ordinary Free-Ion Lasers as well. After bunching the ion beam can be extracted from the storage ring in this case. Storage rings with zero momentum compaction function will permit to keep bunching of the ion beam for a long time.

  4. Study of Nuclear Reactions with 11C and 15O Radioactive Ion Beams

    SciTech Connect

    Lee, Dongwon

    2007-05-14

    Nuclear reaction study with radioactive ion beams is one of the most exciting research topics in modern nuclear physics. The development of radioactive ion beams has allowed nuclear scientists and engineers to explore many unknown exotic nuclei far from the valley of nuclear stability, and to further our understanding of the evolution of the universe. The recently developed radioactive ion beam facility at the Lawrence Berkeley National Laboratory's 88-inch cyclotron is denoted as BEARS and provides {sup 11}C, {sup 14}O and {sup 15}O radioactive ion beams of high quality. These moderate to high intensity, proton-rich radioactive ion beams have been used to explore the properties of unstable nuclei such as {sup 12}N and {sup 15}F. In this work, the proton capture reaction on {sup 11}C has been evaluated via the indirect d({sup 11}C, {sup 12}N)n transfer reaction using the inverse kinematics method coupled with the Asymptotic Normalization Coefficient (ANC) theoretical approach. The total effective {sup 12}N {yields} {sup 11}C+p ANC is found to be (C{sub eff}{sup 12{sub N}}){sup 2} = 1.83 {+-} 0.27 fm{sup -1}. With the high {sup 11}C beam intensity available, our experiment showed excellent agreement with theoretical predictions and previous experimental studies. This study also indirectly confirmed that the {sup 11}C(p,{gamma}) reaction is a key step in producing CNO nuclei in supermassive low-metallicity stars, bypassing the slow triple alpha process. The newly developed {sup 15}O radioactive ion beam at BEARS was used to study the poorly known level widths of {sup 16}F via the p({sup 15}O,{sup 15}O)p reaction. Among the nuclei in the A=16, T=1 isobaric triad, many states in {sup 16}N and {sup 16}O have been well established, but less has been reported on {sup 16}F. Four states of {sup 16}F below 1 MeV have been identified experimentally: 0{sup -}, 1{sup -}, 2{sup -}, and 3{sup -} (E{sub x} = 0.0, 0.19, 0.42, and 0.72 MeV, respectively). Our study utilized R

  5. Study of nuclear reactions with carnon-11 and oxygen-15 radioactive ion beams

    NASA Astrophysics Data System (ADS)

    Lee, Dongwon

    Nuclear reaction study with radioactive ion beams is one of the most exciting research topics in modern nuclear physics. The development of radioactive ion beams has allowed nuclear scientists and engineers to explore many unknown exotic nuclei far from the valley of nuclear stability, and to further our understanding of the evolution of the universe. The recently developed radioactive ion beam facility at the Lawrence Berkeley National Laboratory's 88-inch cyclotron is denoted as BEARS and provides 11C, 14O and 15O radioactive ion beams of high quality. These moderate to high intensity, proton-rich radioactive ion beams have been used to explore the properties of unstable nuclei such as 12N and 15F. In this work, the proton capture reaction on 11C has been evaluated via the indirect d(11C,12N)n transfer reaction using the inverse kinematics method coupled with the Asymptotic Normalization Coefficient (ANC) theoretical approach. The total effective 12N→11C +p ANC is found to be C12Neff 2 = 1.83 +/- 0.27 fm-1. With the high 11C beam intensity available, our experiment showed excellent agreement with theoretical predictions and previous experimental studies. This study also indirectly confirmed that the 11C(p,gamma) reaction is a key step in producing CNO nuclei in supermassive low-metallicity stars, bypassing the slow triple alpha process. The newly developed 15O radioactive ion beam at BEARS was used to study the poorly known level widths of 16F via the p(15O,15O)p reaction. Among the nuclei in the A=16, T=1 isobaric triad, many states in 16N and 16O have been well established, but less has been reported on 16F. Four states of 16F below 1 MeV have been identified experimentally: 0-, 1-, 2-, and 3- (Ex = 0.0, 0.19, 0.42, and 0.72 MeV, respectively). Our study utilized R-matrix analysis and found that the 0- state has a level width of 23.1 +/- 2.2 keV, and that the broader 1 - state has a width of 91.1 +/- 9.9 keV. The level width of the 2- state is found to be 3

  6. Monte Carlo simulations of nanoscale focused neon ion beam sputtering.

    PubMed

    Timilsina, Rajendra; Rack, Philip D

    2013-12-13

    A Monte Carlo simulation is developed to model the physical sputtering of aluminum and tungsten emulating nanoscale focused helium and neon ion beam etching from the gas field ion microscope. Neon beams with different beam energies (0.5-30 keV) and a constant beam diameter (Gaussian with full-width-at-half-maximum of 1 nm) were simulated to elucidate the nanostructure evolution during the physical sputtering of nanoscale high aspect ratio features. The aspect ratio and sputter yield vary with the ion species and beam energy for a constant beam diameter and are related to the distribution of the nuclear energy loss. Neon ions have a larger sputter yield than the helium ions due to their larger mass and consequently larger nuclear energy loss relative to helium. Quantitative information such as the sputtering yields, the energy-dependent aspect ratios and resolution-limiting effects are discussed. PMID:24231648

  7. CW/Pulsed H- ion beam generation with PKU Cs-free 2.45 GHz microwave driven ion source

    NASA Astrophysics Data System (ADS)

    Peng, S. X.; Ren, H. T.; Xu, Y.; Zhang, T.; Zhang, A. L.; Zhang, J. F.; Zhao, J.; Guo, Z. Y.; Chen, J. E.

    2015-04-01

    Circular accelerators used for positron emission tomography (PET, i.e. accelerator used for make radio isotopes) need several mA of CW H- ion beam for their routine operation. Other facilities, like Space Radio-Environment Simulate Assembly (SPRESA), require less than 10 mA pulsed mode H- beam. Caesium free negative hydrogen ion source is a good choice for those facilities because of its compact structure, easy operation and low cost. Up to now, there is no H- source able to produce very intense H- beams with important variation of the duty factor[1]. Recently, a new version of 2.45 GHz microwave H- ion source was designed at PKU, based on lessons learnt from the previous one. This non cesiated source is very compact thanks to its permanent magnet configuration. Special attention was paid on the design of the discharge chamber structure, electron dumping and extraction system. Source test to produce H- ion beams in pulsed and CW mode was carried out on PKU ion source test bench. In CW mode, a 10.8 mA/30keV H- beam with rms emittance about 0.16 π.mm.mrad has been obtained with only 500 W rf power. The power efficiency reaches 21 mA/kW. In pulsed mode with duty factor of 10% (100Hz/1ms), this compact source can easily deliver 20 mA H- ion beam at 35 keV with rms emittance about 0.2 π.mm.mrad when RF power is set at 2.2 kW (peak power). Several hour successive running operation in both modes and totaling more than 200 hours proves its high quality. The outside dimension of this new H- source body is ϕ116 mm × 124 mm, and the entire H- source infrastructure, including rf matching section, plasma chamber and extraction system, is ϕ310 × 180 mm. The high voltage region is limited with in a ϕ310 mm × 230 mm diagram. Details are given in this paper.

  8. Ion fluence dependence of the total sputtering yield and differential angular sputtering yield of bismuth due to 50 keV argon ion irradiation

    NASA Astrophysics Data System (ADS)

    Deoli, Naresh T.; Phinney, Lucas C.; Weathers, Duncan L.

    2014-08-01

    The dependences of the total sputtering yield of Bi and the differential angular distribution of these sputtered Bi atoms on the fluence of 50 keV Ar+ ions at normal incidence have been experimentally measured. Polycrystalline Bi targets were used for these purposes. The collector technique and accurate current integration methods were adopted for the determination of angular distributions of sputtered Bi atoms. The ion fluence was varied from 1.9 × 1019 to 3.1 × 1020 ions/cm2. The sputtered atoms were collected on high purity aluminum foils under ultra-high vacuum (∼5 × 10-9 Torr). The collector foils were subsequently analyzed using heavy ion Rutherford backscattering spectroscopy. The shape of the angular distribution of sputtered atoms was found not to change significantly with the fluence, but the sputtering yield increased significantly from 2.2 ± 0.2 to 9.6 ± 0.6 atoms/ion over the fluence range studied.

  9. The response of the pyrochlore structure-type to ion-beam irradiation

    NASA Astrophysics Data System (ADS)

    Lian, Jie

    Pyrochlore with the general formula of A3+2B4+2O7 (Fd3m; Z = 8) has been proposed as the candidate waste form for the immobilization of actinides, particularly plutonium from dismantled nuclear weapons. Because actinides decay by alpha-decay events, radiation effects on the waste form are a concern. The effects of radiation on different pyrochlore compositions, A2B2O7 (A = La ˜ Lu, and Y; B = Ti, Sn, and Zr), have been investigated by 50 KeV He+, 600 KeV Ar+, 1.0 MeV Kr+, and 1.5 MeV Xe+ ion irradiations. Titanate pyrochlores are generally sensitive to ion beam damage and can be amorphized at a low damage level (˜0.2 dpa). The critical amorphization temperature, Tc, increases from ˜480 to ˜1120 K with increasing A-site cation size. A dramatically increasing radiation "resistance" to ion beam induced-amorphization has been observed with increasing Zr-content in the Gd2Ti2-xZrxO7 system. The pure end-member, Gd2Zr2O7, cannot be amorphized, even at doses as high as ˜100 dpa. Although zirconate pyrochlores are generally considered to be radiation "resistant", ion beam-induced amorphization occurs for La2Zr2O7 at a dose of ˜5.5 dpa at room temperature. Stannate pyrochlores A2Sn 2O7 (A = La, Nd, Gd) are readily amorphized by ion beam damage at a relatively low dose (˜1 dpa) at room temperature; while no evidence of amorphization has been observed in A2Sn2O7 (A = Er, Y, Lu) irradiated with 1 MeV Kr+ ions at a dose of ˜6 dpa at 25 K. The factors that influence the response of different pyrochlore compositions to ion irradiation-induced amorphization are discussed in terms of cation radius ratio, defect formation energies, and the tendency of the pyrochlore structure-type to undergo an order-disorder transition to the defect-fluorite structure. The "resistance" of the pyrochlore structure to ion beam-induced amorphization is not only affected by the relative sizes of the A- and B-site cations, but also the cation electronic configurations. Pyrochlore compositions

  10. Direct reaction measurements with a 132Sn radioactive ion beam

    SciTech Connect

    Jones, Katherine L.; Nunes, Filomena M.; Adekola, Aderemi S.; Bardayan, Dan W.; Blackmon, Jeff; Chae, K. Y.; Chipps, Kelly A.; Cizewski, Jolie A.; Erikson, Luke E.; Harlin, C.; Hatarik, R.; Kapler, R.; Kozub, Raymond L.; Liang, J. F.; Livesay, Ronald J.; Ma, Zhongguo J.; Moazen, B. H.; Nesaraja, Caroline D.; Pain, Steven D.; Patterson, N. P.; Shapira, Dan; Shriner, Jr., John F.; Smith, Michael S.; Swan, Thomas P.; Thomas, Jeff S.

    2011-09-01

    The (d,p) neutron transfer and (d,d) elastic scattering reactions were measured in inverse kinematics using a radioactive ion beam of 132Sn at 630 MeV. The elastic scattering data were taken in a region where Rutherford scattering dominated the reaction, and nuclear effects account for less than 8% of the elastic scattering cross section. The magnitude of the nuclear effects, in the angular range studied, was found to be independent of the optical potential used, allowing the transfer data to be normalized in a reliable manner. The neutron-transfer reaction populated a previously unmeasured state at 1363 keV, which is most likely the single-particle 3p1/2 state expected above the N = 82 shell closure. The data were analyzed using finite-range adiabatic-wave calculations and the results compared with the previous analysis using the distorted-wave Born approximation. Angular distributions for the ground and first-excited states are consistent with the previous tentative spin and parity assignments. Spectroscopic factors extracted from the differential cross sections are similar to those found for the one-neutron states beyond the benchmark doubly magic nucleus 208Pb.

  11. Direct reaction measurements with a (132)Sn radioactive ion beam

    SciTech Connect

    Jones, K. L.; Chae, K. Y.; Kapler, R.; Ma, Zhanwen; Moazen, Brian; Cizewski, J. A.; Hatarik, Robert; Pain, S. D.; Swan, T. P.; Nunes, F. M.; Adekola, Aderemi S; Bardayan, Daniel W; Blackmon, Jeff C; Chae, Kyung Yuk; Liang, J Felix; Nesaraja, Caroline D; Pain, Steven D; Shapira, Dan; Smith, Michael Scott; Chipps, Kelly A; Erikson, Luke; Livesay, R. J.; Harlin, Christopher W; Patterson, N. P.; Thomas, J. S.; Kozub, R. L.; Shriner, Jr., John F

    2011-01-01

    The (d,p) neutron transfer and (d,d) elastic scattering reactions were measured in inverse kinematics using a radioactive ion beam of {sup 132}Sn at 630 MeV. The elastic scattering data were taken in a region where Rutherford scattering dominated the reaction, and nuclear effects account for less than 8% of the elastic scattering cross section. The magnitude of the nuclear effects, in the angular range studied, was found to be independent of the optical potential used, allowing the transfer data to be normalized in a reliable manner. The neutron-transfer reaction populated a previously unmeasured state at 1363 keV, which is most likely the single-particle 3p{sub 1/2} state expected above the N=82 shell closure. The data were analyzed using finite-range adiabatic-wave calculations and the results compared with the previous analysis using the distorted-wave Born approximation. Angular distributions for the ground and first-excited states are consistent with the previous tentative spin and parity assignments. Spectroscopic factors extracted from the differential cross sections are similar to those found for the one-neutron states beyond the benchmark doubly magic nucleus {sup 208}Pb.

  12. Direct reaction measurements with a 132Sn radioactive ion beam

    NASA Astrophysics Data System (ADS)

    Jones, K. L.; Nunes, F. M.; Adekola, A. S.; Bardayan, D. W.; Blackmon, J. C.; Chae, K. Y.; Chipps, K. A.; Cizewski, J. A.; Erikson, L.; Harlin, C.; Hatarik, R.; Kapler, R.; Kozub, R. L.; Liang, J. F.; Livesay, R.; Ma, Z.; Moazen, B.; Nesaraja, C. D.; Pain, S. D.; Patterson, N. P.; Shapira, D.; Shriner, J. F., Jr.; Smith, M. S.; Swan, T. P.; Thomas, J. S.

    2011-09-01

    The (d,p) neutron transfer and (d,d) elastic scattering reactions were measured in inverse kinematics using a radioactive ion beam of 132Sn at 630 MeV. The elastic scattering data were taken in a region where Rutherford scattering dominated the reaction, and nuclear effects account for less than 8% of the elastic scattering cross section. The magnitude of the nuclear effects, in the angular range studied, was found to be independent of the optical potential used, allowing the transfer data to be normalized in a reliable manner. The neutron-transfer reaction populated a previously unmeasured state at 1363 keV, which is most likely the single-particle 3p1/2 state expected above the N=82 shell closure. The data were analyzed using finite-range adiabatic-wave calculations and the results compared with the previous analysis using the distorted-wave Born approximation. Angular distributions for the ground and first-excited states are consistent with the previous tentative spin and parity assignments. Spectroscopic factors extracted from the differential cross sections are similar to those found for the one-neutron states beyond the benchmark doubly magic nucleus 208Pb.

  13. Formation of amorphous and crystalline phases in the ion beam modified boron-iron system studied by Mössbauer spectroscopy

    NASA Astrophysics Data System (ADS)

    Hans, M.; Frech, G.; Wolf, G. K.; Wagner, F. E.

    1991-02-01

    Modifications of α-iron by ion implantation of boron ions and ion beam mixing (IBM) at the B-Fe interface were studied by transmission Mössbauer spectroscopy (TMS) and conversion electron Mössbauer spectroscopy (CEMS). Different fluences of 30 keV B + ions were implanted at both room temperature and liquid nitrogen temperature. For comparison, ion implantation at room temperature was performed with an ion energy of 60 keV. The Mössbauer spectra revealed the formation of amorphous phases with a composition similar to that of amorphous films obtained by sputter deposition. Ion implantation at liquid nitrogen temperature increased the amorphous fraction. The annealing behaviour was studied from liquid nitrogen temperature up to about 700 K. Crystallization of the amorphous phases occurred between 373 and 573 K. Deposition of boron layers onto iron samples followed by 120 keV Ar + ion beam mixing at room temperature was studied by CEMS. The spectra again showed the formation of amorphous iron-boron phases but with a higher boron concentration than after ion implantation with the same fluence. The results contribute to the understanding of wear reduction in iron and steels by boron ion implantation and ion beam mixed boron films.

  14. Caborane beam from ITEP Bernas ion source for semiconductor implanters

    SciTech Connect

    Seleznev, D.; Hershcovitch, A.; Kropachev, G.; Kozlov, A.; Kuibeda, R.; Koshelev, V.; Kulevoy, T.; Jonson, B.; Poole, J.; Alexeyenko, O.; Gurkova, E.; Oks, E.; Gushenets, V.; Polozov, S.; Masunov, E.

    2010-02-01

    A joint research and development of steady state intense boron ion sources for hundreds of electron-volt ion implanters has been in progress for the past 5 years. The difficulties of extraction and transportation of low energy boron beams can be solved by implanting clusters of boron atoms. In Institute for Theoretical and Experimental Physics (ITEP) the Bernas ion source successfully generated the beam of decaborane ions. The carborane (C{sub 2}B{sub 10}H{sub 12}) ion beam is more attractive material due to its better thermal stability. The results of carborane ion beam generation are presented. The result of the beam implantation into the silicon wafer is presented as well.

  15. Ion-beam mixing in silicon and germanium at low temperatures

    SciTech Connect

    Clark, G.J.; Marwick, A.D.; Poker, D.B.

    1982-01-01

    Ion-beam mixing of thin marker layers in amorphous silicon and germanium was studied using irradiations with Xe ions at temperatures of 34k and 77k. The marker species, ion energies and doses were: in silicon, markers of Ge and Pt irradiated with 200-keV Xe up to 2.7x10/sup 16/ ions cm/sup -2/; and in germanium, markers of Al and Si bombarded with 295-keV Xe up to 1.63x10/sup 16/ ions cm/sup -2/. In silicon, Pt markers were found to broaden at about the same rate at 34k and 77k; and the rate of broadening was similar to that found by other workers when expressed as an efficiency of mixing, i.e., when dependence on ion dose and deposited energy was factored out. However, a Ge marker irradiated at 34k did not broaden from its original thickness. In germanium, markers of both Al and Si were mixed by irradiation at 34k, but at 77k only the Al marker broadened; the Si marker did not. The broadening of the markers is ascribed to ballistic mixing, while the cases where no broadening occurred are explicable if diffusion by a defect mechanism transported displaced marker atoms back to traps near their original sites.

  16. Synthesis Of Noble Metal Nanoparticle Composite Glasses Using Low Energy Ion Beam Mixing

    SciTech Connect

    Varma, Ranjana S.; Kothari, D. C.; Mahadkar, A. G.; Kulkarni, N. A.; Kanjilal, D.; Kumar, P.

    2010-12-01

    Carbon coated thin films of Cu or Au on fused silica glasses have been irradiated using 100 keV Ar{sup +} ions at different fluences ranging from 1x10{sup 13} to 1x10{sup 16} ion/cm{sup 2}. In this article, we explore a route to form noble metal nanoparticles in amorphous glass matrices without post irradiation annealing using low energy ion beam mixing where nuclear energy loss process is dominant. Optical and structural properties were studied using UV-Vis-NIR absorbance spectroscopy and Glancing angle X-ray Diffraction (GXRD). Results showed that Cu and Au nanoparticles are formed at higher fluence of 1x10{sup 16} ion/cm{sup 2} used in this work without annealing. The diameters of metal nanoparticles obtained from UV-Vis NIR and GXRD are in agreement.

  17. Producing metastable nanophase with sharp interface by means of focused ion beam irradiation

    SciTech Connect

    Barna, Arpad; Kotis, Laszlo; Labar, Janos; Osvath, Zoltan; Toth, Attila L.; Menyhard, Miklos; Zalar, Anton; Panjan, Peter

    2009-02-15

    Amorphous carbon/nickel double layers were irradiated by 30 keV Ga{sup +} ions via focused ion beam. The effect of irradiation on the concentration distribution of all constituents was studied by Auger electron spectroscopy depth profiling and cross sectional transmission electron microscopy, while the morphology change of the sample was determined by atomic force microscopy. The Ga{sup +} ion irradiation results in the formation of metastable Ni{sub 3}C layer with a uniform thickness. The C/Ni{sub 3}C and Ni{sub 3}C/Ni interfaces were found to be sharp up to a fluence of 200 Ga{sup +} ions/nm{sup 2}.

  18. Observation of Beam ION Instability in Spear3

    SciTech Connect

    Teytelman, D.; Cai, Y.; Corbett, W.J.; Raubenheimer, T.O.; Safranek, J.A.; Schmerge, J.F.; Sebek, J.J.; Wang, L.; /SLAC

    2011-12-14

    Weak vertical coupled bunch instability with oscillation amplitude at {mu}m level has been observed in SPEAR3. The instability becomes stronger when there is a vacuum pressure rise by partially turning off vacuum pumps and it becomes weaker when the vertical beam emittance is increased by turning off the skew quadrupole magnets. These confirmed that the instability was driven by ions in the vacuum. The threshold of the beam ion instability when running with a single bunch train is just under 200 mA. This paper presents the comprehensive observations of the beam ion instability in SPEAR3. The effects of vacuum pressure, beam current, beam filling pattern, chromaticity, beam emittance and bunch-by-bunch feedback are investigated in great detail. In an electron accelerator, ions generated from the residual gas molecules can be trapped by the beam. Then these trapped ions interact resonantly with the beam and cause beam instability and emittance blow-up. Most existing light sources use a long single bunch train filling pattern, followed by a long gap to avoid multi-turn ion trapping. However, such a gap does not preclude ions from accumulating during one passage of the single bunch train beam, and those ions can still cause a Fast Ion Instability (FII) as predicted by Raubenheimer and Zimmermann. FII has been observed in ALS, and PLS by artificially increasing the vacuum pressure by injecting helium gas into the vacuum chamber or by turning off the ion pumps in order to observe the beam ion instability. In some existing rings, for instance B factory, the beam ion instability was observed at the beginning of the machine operation after a long period of shutdown and then it automatically disappeared when the vacuum was better. However, when the beam emittance becomes smaller, the FII can occur at nominal conditions as observed in PLS, SOLEIL and SSRF. This paper reports the observations of beam ion instabilities in SPEAR3 under different condition during a period of one

  19. Space Charge Neutralization of DEMO Relevant Negative Ion Beams at Low Gas Density

    SciTech Connect

    Surrey, Elizabeth; Porton, Michael

    2011-09-26

    The application of neutral beams to future power plant devices (DEMO) is dependent on achieving significantly improved electrical efficiency and the most promising route to achieving this is by implementing a photoneutralizer in place of the traditional gas neutralizer. A corollary of this innovation would be a significant reduction in the background gas density through which the beam is transported between the accelerator and the neutralizer. This background gas is responsible for the space charge neutralization of the beam, enabling distances of several metres to be traversed without significant beam expansion. This work investigates the sensitivity of a D{sup -} beam to reduced levels of space charge compensation for energies from 100 keV to 1.5 MeV, representative of a scaled prototype experiment, commissioning and full energy operation. A beam transport code, following the evolution of the phase space ellipse, is employed to investigate the effect of space charge on the beam optics. This shows that the higher energy beams are insensitive to large degrees of under compensation, unlike the lower energies. The probable degree of compensation at low gas density is then investigated through a simple, two component beam-plasma model that allows the potential to be negative. The degree of under-compensation is dependent on the positive plasma ion energy, one source of which is dissociation of the gas by the beam. The subsequent space charge state of the beam is shown to depend upon the relative times for equilibration of the dissociation energy and ionization by the beam ions.

  20. Ion Beam Sputtered Coatings of Bioglass

    NASA Technical Reports Server (NTRS)

    Hench, Larry L.; Wilson, J.; Ruzakowski, Patricia Henrietta Anne

    1982-01-01

    The ion beam sputtering technique available at the NASA-Lewis was used to apply coatings of bioglass to ceramic, metallic, and polymeric substrates. Experiments in vivo and in vitro described investigate these coatings. Some degree of substrate masking was obtained in all samples although stability and reactivity equivalent to bulk bioglass was not observed in all coated samples. Some degree of stability was seen in all coated samples that were reacted in vitro. Both metallic and ceramic substrates coated in this manner failed to show significantly improved coatings over those obtained with existing techniques. Implantation of the coated ceramic substrate samples in bone gave no definite bonding as seen with bulk glass; however, partial and patchy bonding was seen. Polymeric substrates in these studies showed promise of success. The coatings applied were sufficient to mask the underlying reactive test surface and tissue adhesion of collagen to bioglass was seen. Hydrophilic, hydrophobic, charged, and uncharged polymeric surfaces were successfully coated.

  1. The damaging effects of nitrogen ion beam implantation on upland cotton ( Gossypium hirsutum L.) pollen grains

    NASA Astrophysics Data System (ADS)

    Yu, Yanjie; Wu, Lijun; Wu, Yuejin; Wang, Qingya; Tang, Canming

    2008-09-01

    With the aim to study the effects of an ion beam on plant cells, upland cotton (Gossypium hirsutum L.) cultivar "Sumian 22" pollen grains were irradiated in vacuum (7.8 × 10-3 Pa) by low-energy nitrogen ions with an energy of 20 keV at various fluences ranging from 0.26 × 1016 to 0.78 × 1016 N+/cm2. The irradiation effects on pollen grains were tested, considering the ultrastructural changes in the exine and interior walls of pollen grains, their germination rate, the growth speed of the pollen tubes in the style, fertilization and boll development after the pistils were pollinated by the pollen grains which had been implanted with nitrogen ions. Nitrogen ions entered the pollen grains by etching and penetrating the exine and interior walls and destroying cell structures. A greater percentage of the pollen grains were destroyed as the fluence of N+ ions increased. Obviously, the nitrogen ion beam penetrated the exine and interior walls of the pollen grains and produced holes of different sizes. As the ion fluence increased, the amount and the density of pollen grain inclusions decreased and the size of the lacuna and starch granules increased. Pollen grain germination rates decreased with increasing ion fluence. The number of pollen tubes in the style declined with increased ion implantation into pollen grains, but the growth speed of the tubes did not change. All of the pollen tubes reached the end of the style at 13 h after pollination. This result was consistent with that of the control. Also, the weight and the diameter of the ovary decreased and shortened with increased ion beam implantation fluence. No evident change in the fecundation time of the ovule was observed. These results indicate that nitrogen ions can enter pollen grains and cause a series of biological changes in pollen grains of upland cotton.

  2. Optics of ion beams for the neutral beam injection system on HL-2A Tokamak

    SciTech Connect

    Zou, G. Q.; Lei, G. J.; Cao, J. Y.; Duan, X. R.

    2012-07-15

    The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage ({approx}100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak.

  3. Optics of ion beams for the neutral beam injection system on HL-2A Tokamak.

    PubMed

    Zou, G Q; Lei, G J; Cao, J Y; Duan, X R

    2012-07-01

    The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage (∼100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak. PMID:22852685

  4. Prototyping of beam position monitor for medium energy beam transport section of RAON heavy ion accelerator.

    PubMed

    Jang, Hyojae; Jin, Hyunchang; Jang, Ji-Ho; Hong, In-Seok

    2016-02-01

    A heavy ion accelerator, RAON is going to be built by Rare Isotope Science Project in Korea. Its target is to accelerate various stable ions such as uranium, proton, and xenon from electron cyclotron resonance ion source and some rare isotopes from isotope separation on-line. The beam shaping, charge selection, and modulation should be applied to the ions from these ion sources because RAON adopts a superconducting linear accelerator structure for beam acceleration. For such treatment, low energy beam transport, radio frequency quadrupole, and medium energy beam transport (MEBT) will be installed in injector part of RAON accelerator. Recently, development of a prototype of stripline beam position monitor (BPM) to measure the position of ion beams in MEBT section is under way. In this presentation, design of stripline, electromagnetic (EM) simulation results, and RF measurement test results obtained from the prototyped BPM will be described. PMID:26932088

  5. Prototyping of beam position monitor for medium energy beam transport section of RAON heavy ion accelerator

    NASA Astrophysics Data System (ADS)

    Jang, Hyojae; Jin, Hyunchang; Jang, Ji-Ho; Hong, In-Seok

    2016-02-01

    A heavy ion accelerator, RAON is going to be built by Rare Isotope Science Project in Korea. Its target is to accelerate various stable ions such as uranium, proton, and xenon from electron cyclotron resonance ion source and some rare isotopes from isotope separation on-line. The beam shaping, charge selection, and modulation should be applied to the ions from these ion sources because RAON adopts a superconducting linear accelerator structure for beam acceleration. For such treatment, low energy beam transport, radio frequency quadrupole, and medium energy beam transport (MEBT) will be installed in injector part of RAON accelerator. Recently, development of a prototype of stripline beam position monitor (BPM) to measure the position of ion beams in MEBT section is under way. In this presentation, design of stripline, electromagnetic (EM) simulation results, and RF measurement test results obtained from the prototyped BPM will be described.

  6. An electron cyclotron resonance ion source based low energy ion beam platform.

    PubMed

    Sun, L T; Shang, Y; Ma, B H; Zhang, X Z; Feng, Y C; Li, X X; Wang, H; Guo, X H; Song, M T; Zhao, H Y; Zhang, Z M; Zhao, H W; Xie, D Z

    2008-02-01

    To satisfy the requirements of surface and atomic physics study in the field of low energy multiple charge state ion incident experiments, a low energy (10 eV/q-20 keV/q) ion beam platform is under design at IMP. A simple test bench has been set up to test the ion beam deceleration systems. Considering virtues such as structure simplicity, easy handling, compactness, cost saving, etc., an all-permanent magnet ECRIS LAPECR1 [Lanzhou all-permanent magnet electron cyclotron resonance (ECR) ion source No. 1] working at 14.5 GHz has been adopted to produce intense medium and low charge state ion beams. LAPECR1 source has already been ignited. Some intense low charge state ion beams have been produced on it, but the first test also reveals that many problems are existing on the ion beam transmission line. The ion beam transmission mismatches result in the depressed performance of LAPECR1, which will be discussed in this paper. To obtain ultralow energy ion beam, after being analyzed by a double-focusing analyzer magnet, the selected ion beam will be further decelerated by two afocal deceleration lens systems, which is still under design. This design has taken into consideration both ions slowing down and also ion beam focusing. In this paper, the conceptual design of deceleration system will be discussed. PMID:18315202

  7. Mechanisms of Focused Ion Beam Implantation Damage and Recovery in Si

    NASA Astrophysics Data System (ADS)

    Balasubramanian, G. P. S.; Hull, R.

    2016-06-01

    The ion current density in focused ion beam (FIB) systems, 0.1-10 A cm-2, is at least three orders of magnitude greater than that in commercial broad ion beam implanters. This large difference in ion current density is expected to strongly affect the damage recovery dynamics. In this work, we study the ion implantation damage and recovery of Si(100) substrates implanted with 1 × 1012-5 × 1015 Si cm-2 fluences of 60-keV Si2+ at normal incidence in a mass-selecting FIB. Additionally, damage and recovery in different broad ion beam implants of 60-keV Si+ were studied for a comparison. For recovering implantation damage, specimens were annealed for different times at 730-900°C in an ultra-high purity nitrogen ambient, and for characterizing damage and recovery, Raman spectroscopy at wavelengths 405 nm and 514 nm was carried out. Raman measurements comprised of measurements of crystalline Si (c-Si) peak height of the peak at 520 cm-1, and the peak shift relative to that of un-implanted reference Si. Our measurements of structural damage—calculated from the attenuation in the c-Si peak heights for the implants relative to that of unimplanted Si(100)—indicates that the FIB implantations lead to a greater as-implanted damage but also typically lead to a better recovery than that for the commercial broad-area implants. The underlying mechanisms for these observations are discussed.

  8. Ion beam sputter deposited zinc telluride films

    NASA Technical Reports Server (NTRS)

    Gulino, D. A.

    1985-01-01

    Zinc telluride is of interest as a potential electronic device material, particularly as one component in an amorphous superlattice, which is a new class of interesting and potentially useful materials. Some structural and electronic properties of ZnTe films deposited by argon ion beam sputter depoairion are described. Films (up to 3000 angstroms thick) were deposited from a ZnTe target. A beam energy of 1000 eV and a current density of 4 mA/sq. cm. resulted in deposition rates of approximately 70 angstroms/min. The optical band gap was found to be approximately 1.1 eV, indicating an amorphous structure, as compared to a literature value of 2.26 eV for crystalline material. Intrinsic stress measurements showed a thickness dependence, varying from tensile for thicknesses below 850 angstroms to compressive for larger thicknesses. Room temperature conductivity measurement also showed a thickness dependence, with values ranging from 1.86 x to to the -6/ohm. cm. for 300 angstrom film to 2.56 x 10 to the -1/ohm. cm. for a 2600 angstrom film. Measurement of the temperature dependence of the conductivity for these films showed complicated behavior which was thickness dependent. Thinner films showed at least two distinct temperature dependent conductivity mechanisms, as described by a Mott-type model. Thicker films showed only one principal conductivity mechanism, similar to what might be expected for a material with more crystalline character.

  9. Ion beam sputter deposited zinc telluride films

    NASA Technical Reports Server (NTRS)

    Gulino, D. A.

    1986-01-01

    Zinc telluride is of interest as a potential electronic device material, particularly as one component in an amorphous superlattice, which is a new class of interesting and potentially useful materials. Some structural and electronic properties of ZnTe films deposited by argon ion beam sputter deposition are described. Films (up to 3000 angstroms thick) were deposited from a ZnTe target. A beam energy of 1000 eV and a current density of 4 mA/sq cm resulted in deposition rates of approximately 70 angstroms/min. The optical band gap was found to be approximately 1.1 eV, indicating an amorphous structure, as compared to a literature value of 2.26 eV for crystalline material. Intrinsic stress measurements showed a thickness dependence, varying from tensile for thicknesses below 850 angstroms to compressive for larger thicknesses. Room temperature conductivity measurement also showed a thickness dependence, with values ranging from 1.86 x 10 to the -6th/ohm cm for 300 angstrom film to 2.56 x 10 to the -1/ohm cm for a 2600 angstrom film. Measurement of the temperature dependence of the conductivity for these films showed complicated behavior which was thickness dependent. Thinner films showed at least two distinct temperature dependent conductivity mechanisms, as described by a Mott-type model. Thicker films showed only one principal conductivity mechanism, similar to what might be expected for a material with more crystalline character.

  10. Ion beam driven ion-acoustic waves in a plasma cylinder with negative ions

    SciTech Connect

    Sharma, Suresh C.; Gahlot, Ajay

    2008-07-15

    An ion beam propagating through a magnetized plasma cylinder containing K{sup +} positive ions, electrons, and SF{sub 6}{sup -} negative ions drives electrostatic ion-acoustic (IA) waves to instability via Cerenkov interaction. Two electrostatic IA wave modes in presence of K{sup +} and SF{sub 6}{sup -} ions are studied. The phase velocity of the sound wave in presence of positive and negative ions increase with the relative density of negative ions. The unstable wave frequencies and the growth rate of both the modes in presence of positive and negative ions increase with the relative density of negative ions. The growth rate of both the unstable modes in presence of SF{sub 6}{sup -} and K{sup +} ions scales as the one-third power of the beam density. Numerical calculations of the phase velocity, growth rate, and mode frequencies have been carried out for the parameters of the experiment of Song et al. [Phys. Fluids B 3, 284 (1991)].

  11. A channel for modification of materials with post-accelerated or decelerated multiply charged ion beams

    NASA Astrophysics Data System (ADS)

    Dobrosavljević, A.; Nešković, N.; Beličev, P.; Čomor, J. J.; Vujović, V.; Balvanović, R.; Ristić-Djurović, J.

    2008-12-01

    At present, heavy ion beams from the electron cyclotron resonance (ECR) ion source in the Laboratory of Physics of the Vinča Institute of Nuclear Sciences, Belgrade, Serbia, are employed in a channel for surface modification of materials. The source and channel were commissioned in 1998, and have been used since that time by a number of user groups from the Vinča Institute and other scientific and educational institutions in Serbia. However, since the maximum extraction voltage of the source is +25 kV, sometimes the extracted beams do not have sufficiently high energies for such applications. Therefore, in order to solve this problem, we have decided to construct a new channel, to be used for deeper modification of materials. The beams obtained from the source will be post-accelerated by biasing the target to be irradiated to the negative potentials of down to -100 kV. For example, we shall be able to bombard the target with the 132Xe 24+ beam of the energy of up to 3 MeV, instead of up to 600 keV, in the case without the biasing system. An additional possibility will be to bias the target to the positive potentials of up to +25 kV and thus decelerate the beams extracted from the source down to the energies of about 1 keV. Consequently, one will be able to modify materials with the beams in a wide energy range, from ˜1 to ˜3 MeV, which is rarely met at similar experimental set-ups. It must be noted that changing the post-accelerated or decelerated beam energy in the new channel will be performed simply by adjusting the power supply of the biasing system, without any adjustments of the source and of the transport elements between the source and the interaction chamber.

  12. Simulations and Observations of Heating of Auroral Ion Beams

    NASA Technical Reports Server (NTRS)

    Winglee, R. M.; Dusenbery, P. B.; Collin, H. L.; Lin, C. S.; Persoon, A. M.

    1989-01-01

    In the auroral zone, quasi-static parallel electric fields produce beams of ionospheric ions (e.g., H(+), He(+) and 0(+)), which flow outward into the magnetosphere, providing a significant source of ions for the ring current and plasma sheet. Because the velocities to which these beams are accelerated is dependent on the mass of the ions, differential flows between the various ion species can develop which are unstable to an ion-ion streaming instability. Particle simulations and observations from DE 1 are used to investigate the heating of the ion beams produced by this instability. It is shown that there is net transfer of energy from the light ions to the heavy ions, with the heavy ions reaching maximum velocities near the beam velocity of the light ions. Bulk heating of the heavy ions occurs when their relative density is low while high-energy tails are produced when their relative density is high. The heating is primarily parallel to the magnetic field if the difference in the heavy and light ion beam velocities is subsonic while both perpendicular and parallel heating can occur if it is supersonic. In the latter case, very strong heating of an intermediate ion's species such as He(+) can also occur. Comparison with observations shows features consistent with heating via the ion-ion instability including perpendicular heating in the supersonic regime and parallel heating in the subsonic regime and a change in the heating between these regimes as the ratio of the H(+) beam speed to the local sound speed is observed to decrease. This heating is, however, not always observed in association with enhanced wave emissions. This lack of waves is attributed to reabsorption of the waves as the ions become heated.

  13. Combined ion (Ar+, 20 keV) and light irradiation of the quenched Fe-8.25 at % Mn alloy. Separation between thermal and radiation induced long-range effects

    NASA Astrophysics Data System (ADS)

    Ovchinnikov, V. V.; Gushchina, N. V.; Bedin, S. A.

    2016-02-01

    Mössbauer and X-ray diffraction investigations of the radiation-induced α → γ phase transformation and short-range-order formation processes in the quenched Fe-8.25 at % Mn alloy under combined exposure (simultaneous visible light and Ar+ 20-keV ion beam irradiation) are carried out. Combined exposure made it possible to fix the target stationary temperature, and hence, the intensity of thermally-stimulated processes; an energy and ion current density could independently be varied in a wide range. As a result, an important contribution of a non-thermal constituent of ion beam exposure to the structural state of alloy was proved. Only in the presence of ion beam, an α → γ (bcc → fcc) phase transformation and accelerated intraphase processes preparing this transformation are observed in the deep layers of the target (about 103 Rp). With allowance for the relatively low level of thermally and radiation-stimulated processes, radiation-dynamic effects associated with propagation of intense post-cascade solitary waves, which can rearrange metastable matters, are considered as the cause of the observed transformations.

  14. NRL light ion beam research for inertial confinement fusion

    NASA Astrophysics Data System (ADS)

    Cooperstein, G.; Goldstein, S. A.; Mosher, D.; Barker, R. J.; Boller, J. R.; Colombant, D. G.; Drobot, A.; Meger, R. A.; Oliphant, W. F.; Ottinger, P. F.

    1980-11-01

    There is presently great interest in using light ions beams to drive thermonuclear pellets. Terrawatt-level ion beams have been efficiently produced using conventional pulsed power generators at Sandia Laboratory with magnetically-insulated ion diodes and at the Naval Research Laboratory with pinch-reflex ion diodes. Both laboratories have recently focused ion beams to pellet dimensions. This paper reviews recent advances made at NRL in the area of ion production with pinch-reflex diodes, and in the areas of beam focusing and transport. In addition, modulator generator and beam requirements for pellet ignition systems are reviewed and compared with the latest experimental results. These results include the following: (1) production of = or - 100,100 kj proton and deuteron beams with peak ion powers approaching 2 TW on the PITHON generator in collaboration with Physics International Co., (2) focusing of 0.5 TW deuteron beams produced on the NRL Gamble 2 generator to current densities of about 300 kA/sq cm, and (3) efficient transport of 100 kA level ion beams over 1 meter distances using Z-discharge plasma channels.

  15. Production of multiply charged ion beams from solid substances with the mVINIS ion source

    SciTech Connect

    Draganic, I.; Dobrosavljevic, A.; Nedeljkovic, T.; Siljegovic, M.

    2006-03-15

    The mVINIS ion source has enabled us to obtain multiply charged ion beams from gases as well as from solid materials. The solid substance ion beams were produced by using two techniques: (a) the evaporation of metals by using the inlet system based on a minioven and (b) the metal-ions-from-volatile-compounds method (MIVOC) by using the modified gas inlet system. Great efforts were made in the production of high current stable ion beams of solids with relatively high melting points (over 1000 deg. C). The B{sup 3+} ion-beam current of over 300 {mu}A was one of the most intensive beams extracted until now. The obtained multiply charged ion-beam spectra of solid substances (B, Fe, and Zn) are presented as well as some of the corresponding experimental results achieved during the modification of polymers, carbon materials, and fullerenes.

  16. Surface modification using low energy ground state ion beams

    NASA Technical Reports Server (NTRS)

    Chutjian, Ara (Inventor); Hecht, Michael H. (Inventor); Orient, Otto J. (Inventor)

    1990-01-01

    A method of effecting modifications at the surfaces of materials using low energy ion beams of known quantum state, purity, flux, and energy is presented. The ion beam is obtained by bombarding ion-generating molecules with electrons which are also at low energy. The electrons used to bombard the ion generating molecules are separated from the ions thus obtained and the ion beam is directed at the material surface to be modified. Depending on the type of ion generating molecules used, different ions can be obtained for different types of surface modifications such as oxidation and diamond film formation. One area of application is in the manufacture of semiconductor devices from semiconductor wafers.

  17. Plasma and ion barrier for electron beam spot stability

    SciTech Connect

    Kwan, Thomas J. T.; Snell, Charles M.

    2000-03-01

    High-current electron beams of small spot size are used for high-resolution x-ray radiography of dense objects. Intense energy deposition in the bremsstrahlung target causes generation of ions which can propagate upstream and disrupt the electron beam. We have investigated the use of a thin beryllium foil placed 1-2 cm in front of the target, which serves as a barrier for the ions but is essentially transparent to the incoming electron beam. Analysis and computer simulations confirm that this confinement method will halt ion propagation and preserve the spot size stability of the electron beam. (c) 2000 American Institute of Physics.

  18. Finish ion beam treatment of the longrange cylindrical products outer surface in automatic mode

    NASA Astrophysics Data System (ADS)

    Kalin, B. A.; Volkov, N. V.; Valikov, R. A.; Yashin, A. S.; Krivobokov, V. P.; Yanin, S. N.; Asainov, O. Kh; Yurev, Yu N.

    2016-04-01

    The results of using of ion-beam technologies methods for finish treatment of metal products are presented. The experiments were performed at the installation ILUR-03, which allows the operation of cleaning, polishing and surface layers doping of the material of unlimited length cylindrical samples by radial Ar+ ions beam with energy up to 5 keV. The tubes from zirconium alloy E110 up to 500 mm length were used as samples for investigation. It is shown that selected automatic treatment modes reduce the surface roughness over the entire length of the samples and increase uniformity of the surface layer without observable effect on the bulk properties of material. Treatment promotes the formation of oxide films with improved defensive properties.

  19. Status of radioactive ion beams at the HRIBF

    NASA Astrophysics Data System (ADS)

    Stracener, D. W.

    2003-05-01

    Radioactive Ion Beams (RIBs) at the Holifield Radioactive Ion Beam Facility (HRIBF) are produced using the isotope separation on-line technique and are subsequently accelerated up to a few MeV per nucleon for use in nuclear physics experiments. The first RIB experiments at the HRIBF were completed at the end of 1998 using 17F beams. Since then other proton-rich ion beams have been developed and a large number of neutron-rich ion beams are now available. The neutron-rich radioactive nuclei are produced via proton-induced fission of uranium in a low-density matrix of uranium carbide. Recently developed RIBs include 25Al from a silicon carbide target and isobarically pure beams of neutron-rich Ge, Sn, Br and I isotopes from a uranium carbide target.

  20. In-Situ Cleaning of Metal Cathodes Using a Hydrogen Ion Beam

    SciTech Connect

    Dowell, D.H.; King, F.K.; Kirby, R.E.; Schmerge, J.F.; /SLAC

    2005-09-01

    Improving and maintaining the quantum efficiency (QE) of a metal photocathode in an s-band RF gun requires a process for cleaning the surface. In this type of gun, the cathode is typically installed and the system is vacuum baked to {approx}200 degrees C. If the QE is too low, the cathode is usually cleaned with the UV-drive laser. While laser cleaning does increase the cathode QE, it requires fluences close to the damage threshold and rastering the small diameter beam, both of which can produce nonuniform electron emission and potentially damage the cathode. This paper investigates the efficacy of a low energy hydrogen ion beam to produce high-QE metal cathodes. Measurements of the QE vs. wavelength, surface contaminants using x-ray photoelectron spectroscopy and surface roughness were performed on a copper sample, and the results showed a significant increase in QE after cleaning with a 1keV hydrogen ion beam. The H-ion beam cleaned an area approximately 1cm in diameter and had no effect on the surface roughness while significantly increasing the QE. These results and a comparison with theory as well as a scheme for installing an H-ion cleaner on an s-band gun are presented.

  1. Nano-ranged low-energy ion-beam-induced DNA transfer in biological cells

    NASA Astrophysics Data System (ADS)

    Yu, L. D.; Wongkham, W.; Prakrajang, K.; Sangwijit, K.; Inthanon, K.; Thongkumkoon, P.; Wanichapichart, P.; Anuntalabhochai, S.

    2013-06-01

    Low-energy ion beams at a few tens of keV were demonstrated to be able to induce exogenous macromolecules to transfer into plant and bacterial cells. In the process, the ion beam with well controlled energy and fluence bombarded living cells to cause certain degree damage in the cell envelope in nanoscales to facilitate the macromolecules such as DNA to pass through the cell envelope and enter the cell. Consequently, the technique was applied for manipulating positive improvements in the biological species. This physical DNA transfer method was highly efficient and had less risk of side-effects compared with chemical and biological methods. For better understanding of mechanisms involved in the process, a systematic study on the mechanisms was carried out. Applications of the technique were also expanded from DNA transfer in plant and bacterial cells to DNA transfection in human cancer cells potentially for the stem cell therapy purpose. Low-energy nitrogen and argon ion beams that were applied in our experiments had ranges of 100 nm or less in the cell envelope membrane which was majorly composed of polymeric cellulose. The ion beam bombardment caused chain-scission dominant damage in the polymer and electrical property changes such as increase in the impedance in the envelope membrane. These nano-modifications of the cell envelope eventually enhanced the permeability of the envelope membrane to favor the DNA transfer. The paper reports details of our research in this direction.

  2. Historical milestones and future prospects of cluster ion beam technology

    NASA Astrophysics Data System (ADS)

    Yamada, Isao

    2014-08-01

    Development of technology for processing of surfaces by means of gas cluster ion beams began only about a quarter century ago even though fundamental research related to generation of gas clusters began much earlier. Industrial applications of cluster ion beams did not start to be explored until commercial equipment was first introduced to the ion beam community in around 2000. The technology is now evolving rapidly with industrial equipment being engineered for many diverse surface processing applications which are made possible by the unique characteristics of cluster-ion/solid-surface interactions. In this paper, important historical milestones in cluster ion beam development are described. Present activities related to a wide range of industrial applications in semiconductors, magnetic and optical devices, and bio-medical devices are reviewed. Several emerging new advances in cluster beam applications for the future are also discussed.

  3. Lithium ion beam driven hohlraums for PBFA II

    SciTech Connect

    Dukart, R.J.

    1994-05-06

    In our light ion inertial confinement fusion (ICF) program, fusion capsules are driven with an intense x-ray radiation field produced when an intense beam of ions penetrates a radiation case and deposits energy in a foam x-ray conversion region. A first step in the program is to generate and measure these intense fields on the Particle Beam Fusion Accelerator II (PBFA II). Our goal is to generate a 100-eV radiation temperature in lithium ion beam driven hohlraums, the radiation environment which will provide the initial drive temperature for ion beam driven implosion systems designed to achieve high gain. In this paper, we describe the design of such hohlraum targets and their predicted performance on PBFA II as we provide increasing ion beam intensities.

  4. Intense ion beams accelerated by relativistic laser plasmas

    NASA Astrophysics Data System (ADS)

    Roth, Markus; Cowan, Thomas E.; Gauthier, Jean-Claude J.; Allen, Matthew; Audebert, Patrick; Blazevic, Abel; Fuchs, Julien; Geissel, Matthias; Hegelich, Manuel; Karsch, S.; Meyer-ter-Vehn, Jurgen; Pukhov, Alexander; Schlegel, Theodor

    2001-12-01

    We have studied the influence of the target properties on laser-accelerated proton and ion beams generated by the LULI multi-terawatt laser. A strong dependence of the ion emission on the surface conditions, conductivity, shape and material of the thin foil targets were observed. We have performed a full characterization of the ion beam using magnetic spectrometers, Thompson parabolas, radiochromic film and nuclear activation techniques. The strong dependence of the ion beam acceleration on the conditions on the target back surface was found in agreement with theoretical predictions based on the target normal sheath acceleration (TNSA) mechanism. Proton kinetic energies up to 25 MeV have been observed.

  5. On the role of ion-based imaging methods in modern ion beam therapy

    SciTech Connect

    Magallanes, L. Rinaldi, I.; Brons, S.; Marcelos, T. Parodi, K.; Takechi, M.; Voss, B.; Jäkel, O.

    2014-11-07

    External beam radiotherapy techniques have the common aim to maximize the radiation dose to the target while sparing the surrounding healthy tissues. The inverted and finite depth-dose profile of ion beams (Bragg peak) allows for precise dose delivery and conformai dose distribution. Furthermore, increased radiobiological effectiveness of ions enhances the capability to battle radioresistant tumors. Ion beam therapy requires a precise determination of the ion range, which is particularly sensitive to range uncertainties. Therefore, novel imaging techniques are currently investigated as a tool to improve the quality of ion beam treatments. Approaches already clinically available or under development are based on the detection of secondary particles emitted as a result of nuclear reactions (e.g., positron-annihilation or prompt gammas, charged particles) or transmitted high energy primary ion beams. Transmission imaging techniques make use of the beams exiting the patient, which have higher initial energy and lower fluence than the therapeutic ones. At the Heidelberg Ion Beam Therapy Center, actively scanned energetic proton and carbon ion beams provide an ideal environment for the investigation of ion-based radiography and tomography. This contribution presents the rationale of ion beam therapy, focusing on the role of ion-based transmission imaging methods towards the reduction of range uncertainties and potential improvement of treatment planning.

  6. On the role of ion-based imaging methods in modern ion beam therapy

    NASA Astrophysics Data System (ADS)

    Magallanes, L.; Brons, S.; Marcelos, T.; Takechi, M.; Voss, B.; Jäkel, O.; Rinaldi, I.; Parodi, K.

    2014-11-01

    External beam radiotherapy techniques have the common aim to maximize the radiation dose to the target while sparing the surrounding healthy tissues. The inverted and finite depth-dose profile of ion beams (Bragg peak) allows for precise dose delivery and conformai dose distribution. Furthermore, increased radiobiological effectiveness of ions enhances the capability to battle radioresistant tumors. Ion beam therapy requires a precise determination of the ion range, which is particularly sensitive to range uncertainties. Therefore, novel imaging techniques are currently investigated as a tool to improve the quality of ion beam treatments. Approaches already clinically available or under development are based on the detection of secondary particles emitted as a result of nuclear reactions (e.g., positron-annihilation or prompt gammas, charged particles) or transmitted high energy primary ion beams. Transmission imaging techniques make use of the beams exiting the patient, which have higher initial energy and lower fluence than the therapeutic ones. At the Heidelberg Ion Beam Therapy Center, actively scanned energetic proton and carbon ion beams provide an ideal environment for the investigation of ion-based radiography and tomography. This contribution presents the rationale of ion beam therapy, focusing on the role of ion-based transmission imaging methods towards the reduction of range uncertainties and potential improvement of treatment planning.

  7. Suppression of repetitive surface exfoliation of Inconel 625 implanted sequentially with helium ions of different energies (20 100 keV)

    NASA Astrophysics Data System (ADS)

    Rao, A. S.; Whitton, J. L.; Kaminsky, M.

    Studies were conducted to explore if the surface exfoliation of Inconel 625, typical for 100 keV 4He + irradiations can be reduced by pre-irradiating the surfaces with helium ions sequentially over the energy range 20 to 50 keV. Polished, polycrystalline Inconel 625 samples were irradiated at 298K and 573K with 4He + at six different energies in the range from 20 to 50 keV in an order of decreasing energies. For each energy the dose was 0.13 C/cm 2, resulting in a total dose of 0.89 C/cm 2. Subsequently, these samples were implanted with 100 keV 4He + to a dose of 1.0 C/cm 2 or 2.0 C/cm 2. The results reveal that the low energy 4He + implants prior to the 100 keV 4He + implant reduce significantly the erosion yield typical for 100-keV 4He + irradiations alone. For 573K these reduced yields are still about one order of magnitude greater than physical sputtering yields.

  8. Fast ion confinement and stability in a neutral beam injected reversed field pinch

    SciTech Connect

    Anderson, J. K.; Almagri, A. F.; Den Hartog, D. J.; Eilerman, S.; Forest, C. B.; Koliner, J. J.; Mirnov, V. V.; Morton, L. A.; Nornberg, M. D.; Parke, E.; Reusch, J. A.; Sarff, J. S.; Waksman, J.; Belykh, V.; Davydenko, V. I.; Ivanov, A. A.; Polosatkin, S. V.; Tsidulko, Y. A.; Lin, L.; Liu, D.; and others

    2013-05-15

    The behavior of energetic ions is fundamentally important in the study of fusion plasmas. While well-studied in tokamak, spherical torus, and stellarator plasmas, relatively little is known in reversed field pinch plasmas about the dynamics of fast ions and the effects they cause as a large population. These studies are now underway in the Madison Symmetric Torus with an intense 25 keV, 1 MW hydrogen neutral beam injector (NBI). Measurements of the time-resolved fast ion distribution via a high energy neutral particle analyzer, as well as beam-target neutron flux (when NBI fuel is doped with 3–5% D{sub 2}) both demonstrate that at low concentration the fast ion population is consistent with classical slowing of the fast ions, negligible cross-field transport, and charge exchange as the dominant ion loss mechanism. A significant population of fast ions develops; simulations predict a super-Alfvénic ion density of up to 25% of the electron density with both a significant velocity space gradient and a sharp radial density gradient. There are several effects on the background plasma including enhanced toroidal rotation, electron heating, and an altered current density profile. The abundant fast particles affect the plasma stability. Fast ions at the island of the core-most resonant tearing mode have a stabilizing effect, and up to 60% reduction in the magnetic fluctuation amplitude is observed during NBI. The sharp reduction in amplitude, however, has little effect on the underlying magnetic island structure. Simultaneously, beam driven instabilities are observed as repetitive ∼50 μs bursts which coincide with fast particle redistribution; data indicate a saturated core fast ion density well below purely classical predictions.

  9. Direct plasma injection scheme with various ion beams

    SciTech Connect

    Okamura, M.

    2010-09-15

    The laser ion source is one of the most powerful heavy ion sources. However, it is difficult to obtain good stability and to control its intense current. To overcome these difficulties, we proposed a new beam injection scheme called 'direct plasma injection scheme'. Following this it was established to provide various species with desired charge state as an intense accelerated beam. Carbon, aluminum and iron beams have been tested.

  10. A preliminary model of ion beam neutralization. [in thruster plasmas

    NASA Technical Reports Server (NTRS)

    Parks, D. E.; Katz, I.

    1979-01-01

    A theoretical model of neutralized thruster ion beam plasmas has been developed. The basic premise is that the beam forms an electrostatic trap for the neutralizing electrons. A Maxwellian spectrum of electron energies is maintained by collisions between trapped electrons and by collective randomization of velocities of electrons injected from the neutralizer into the surrounding plasma. The theory contains the observed barometric law relationship between electron density and electron temperatures and ion beam spreading in good agreement with measured results.

  11. Beam Compression in Heavy-Ion Induction Linacs

    SciTech Connect

    Seidl, P.A.; Anders, A.; Bieniosek, F.M.; Barnard, J.J.; Calanog, J.; Chen, A.X.; Cohen, R.H.; Coleman, J.E.; Dorf, M.; Gilson, E.P.; Grote, D.P.; Jung, J.Y.; Leitner, M.; Lidia, S.M.; Logan, B.G.; Ni, P.; Roy, P.K.; Van den Bogert, K.; Waldron, W.L.; Welch, D.R.

    2009-01-01

    The Heavy-Ion Fusion Sciences Virtual National Laboratory is pursuing an approach to target heating experiments in the Warm Dense Matter regime, using space-charge-dominated ion beams that are simultaneously longitudinally bunched and transversely focused. Longitudinal beam compression by large factors has been demonstrated in the LBNL Neutralized Drift Compression Experiment (NDCX) experiment with controlled ramps and forced neutralization. The achieved peak beam current and energy can be used in experiments to heat targets and create warm dense matter. Using an injected 30 mA K{sup +} ion beam with initial kinetic energy 0.3 MeV, axial compression leading to {approx}50x current amplification and simultaneous radial focusing to beam radii of a few mm have led to encouraging energy deposition approaching the intensities required for eV-range target heating experiments. We discuss experiments that are under development to reach the necessary higher beam intensities and the associated beam diagnostics.

  12. Measurements of Beam Ion Loss from the Compact Helical System

    SciTech Connect

    D. S. Darrow, M. Isobe, Takashi Kondo, M. Sasao, and the CHS Group National Institute for Fusion Science, Toki, Gifu, Japan

    2010-02-03

    Beam ion loss from the Compact Helical System (CHS) has been measured with a scintillator-type probe. The total loss to the probe, and the pitch angle and gyroradius distributions of that loss, have been measured as various plasma parameters were scanned. Three classes of beam ion loss were observed at the probe position: passing ions with pitch angles within 10o of those of transition orbits, ions on transition orbits, and ions on trapped orbits, typically 15o or more from transition orbits. Some orbit calculations in this geometry have been performed in order to understand the characteristics of the loss. Simulation of the detector signal based upon the following of orbits from realistic beam deposition profiles is not able to reproduce the pitch angle distribution of the losses measured. Consequently it is inferred that internal plasma processes, whether magnetohydrodynamic modes, radial electric fields, or plasma turbulence, move previously confined beam ions to transition orbits, resulting in their loss.

  13. Laser Ion Source Operation at the TRIUMF Radioactive Ion Beam Facility

    NASA Astrophysics Data System (ADS)

    Lassen, J.; Bricault, P.; Dombsky, M.; Lavoie, J. P.; Gillner, M.; Gottwald, T.; Hellbusch, F.; Teigelhöfer, A.; Voss, A.; Wendt, K. D. A.

    2009-03-01

    The TRIUMF Resonant Ionization Laser Ion Source (RILIS) for radioactive ion beam production is presented, with target ion source, laser beam transport, laser system and operation. In this context aspects of titanium sapphire (TiSa) laser based RILIS and facility requirements are discussed and results from the first years of TRILIS RIB delivery are given.

  14. Angular differential cross sections for excitation of atomic hydrogen to its N = 2 level by impact of 15-100 keV He/sup +/ ions

    SciTech Connect

    Aldag, J.E.

    1980-01-01

    Differential cross section for excitation of atomic hydrogen to its n = 2 level by 15-100 keV He/sup +/ ions have been determned for c.m. angles from 0 to 8 mrad. The cross sections were obtained from an analysis of the angular distribution of the scattered ions which had lost an energy corresponding to the excitation of the target to its n = 2 level. The shape of the differential cross section changes rapidly with increasing incident energy. At 15 keV, the cross section changes rapidly with increasing incident energy. At 15 keV, the cross section falls off by a factor of 5 in 6 mrad. At 100 keV, the cross section decreases by nearly six orders or magnitude in the same angular range. The middle and high energy results are in good agreement with a recent Glauber approximation calculation for the scattering. Comparison of the present reduced cross section results with those at lower energy (0.75 to 1.5 keV) indicates that the collision mechanism is not the same. Excitation to n greater than or equal to 3 levels was clearly present in the energy-loss spectra for the process in contradiction to the molecular orbital description of the mechanism. Total cross section results are given for the same scattering process in the 15-200 keV range and are also in good agreement with the Glauber and VPSA theory results. The experimental and Glauber differential results, however, are clearly different at 25 keV.

  15. Direct evidence of strongly inhomogeneous energy deposition in target heating with laser-produced ion beams.

    PubMed

    Brambrink, E; Schlegel, T; Malka, G; Amthor, K U; Aléonard, M M; Claverie, G; Gerbaux, M; Gobet, F; Hannachi, F; Méot, V; Morel, P; Nicolai, P; Scheurer, J N; Tarisien, M; Tikhonchuk, V; Audebert, P

    2007-06-01

    We report on strong nonuniformities in target heating with intense, laser-produced proton beams. The observed inhomogeneity in energy deposition can strongly perturb equation of state (EOS) measurements with laser-accelerated ions which are planned in several laboratories. Interferometric measurements of the target expansion show different expansion velocities on the front and rear surfaces, indicating a strong difference in local temperature. The nonuniformity indicates at an additional heating mechanism, which seems to originate from electrons in the keV range. PMID:17677318

  16. Slow positron beam study of hydrogen ion implanted ZnO thin films

    NASA Astrophysics Data System (ADS)

    Hu, Yi; Xue, Xudong; Wu, Yichu

    2014-08-01

    The effects of hydrogen related defect on the microstructure and optical property of ZnO thin films were investigated by slow positron beam, in combination with x-ray diffraction, infrared and photoluminescence spectroscopy. The defects were introduced by 90 keV proton irradiation with doses of 1×1015 and 1×1016 ions cm-2. Zn vacancy and OH bonding (VZn+OH) defect complex were identified in hydrogen implanted ZnO film by positron annihilation and infrared spectroscopy. The formation of these complexes led to lattice disorder in hydrogen implanted ZnO film and suppressed the luminescence process.

  17. Overview of the negative ion based neutral beam injectors for ITER

    NASA Astrophysics Data System (ADS)

    Schunke, B.; Boilson, D.; Chareyre, J.; Choi, C.-H.; Decamps, H.; El-Ouazzani, A.; Geli, F.; Graceffa, J.; Hemsworth, R.; Kushwah, M.; Roux, K.; Shah, D.; Singh, M.; Svensson, L.; Urbani, M.

    2016-02-01

    The ITER baseline foresees 2 Heating Neutral Beams (HNB's) based on 1 MeV 40 A D- negative ion accelerators, each capable of delivering 16.7 MW of deuterium atoms to the DT plasma, with an optional 3rd HNB injector foreseen as a possible upgrade. In addition, a dedicated diagnostic neutral beam will be injecting ≈22 A of H0 at 100 keV as the probe beam for charge exchange recombination spectroscopy. The integration of the injectors into the ITER plant is nearly finished necessitating only refinements. A large number of components have passed the final design stage, manufacturing has started, and the essential test beds—for the prototype route chosen—will soon be ready to start.

  18. Overview of the negative ion based neutral beam injectors for ITER.

    PubMed

    Schunke, B; Boilson, D; Chareyre, J; Choi, C-H; Decamps, H; El-Ouazzani, A; Geli, F; Graceffa, J; Hemsworth, R; Kushwah, M; Roux, K; Shah, D; Singh, M; Svensson, L; Urbani, M

    2016-02-01

    The ITER baseline foresees 2 Heating Neutral Beams (HNB's) based on 1 MeV 40 A D(-) negative ion accelerators, each capable of delivering 16.7 MW of deuterium atoms to the DT plasma, with an optional 3rd HNB injector foreseen as a possible upgrade. In addition, a dedicated diagnostic neutral beam will be injecting ≈22 A of H(0) at 100 keV as the probe beam for charge exchange recombination spectroscopy. The integration of the injectors into the ITER plant is nearly finished necessitating only refinements. A large number of components have passed the final design stage, manufacturing has started, and the essential test beds-for the prototype route chosen-will soon be ready to start. PMID:26932111

  19. A photoluminescence study of CuInSe2 single crystals ion implanted with 5 keV hydrogen

    NASA Astrophysics Data System (ADS)

    Yakushev, M. V.; Krustok, J.; Grossberg, M.; Volkov, V. A.; Mudryi, A. V.; Martin, R. W.

    2016-03-01

    CuInSe2 single crystals ion implanted with 5 keV hydrogen at doses from 3  ×  1014 to 1016 cm-2 are studied by photoluminescence (PL). The PL spectra before and after implantation reveal two bands, a main dominant band centred at 0.96 eV and a lower intensity band centred at 0.93 eV. Detailed analysis of the shape of these bands, their temperature and excitation intensity dependencies allow the recombination mechanisms to be identified as band-to-tail (BT) and band-to-impurity (BI), respectively. The implantation causes gradual red shifts of the bands increasing linearly with the dose. The average depth of potential fluctuations is also estimated to increase with the dose and saturates for doses above 1015 cm-2. A model is proposed which associates the potential fluctuations with the antisite defects copper on indium site and indium on copper site. The saturation is explained by full randomization of copper and indium atoms on the cation sub-lattice.

  20. Angle-resolved Auger study of 10-keV Ar+-ion-induced Si LMM atomic lines

    NASA Astrophysics Data System (ADS)

    Bonanno, A.; Xu, F.; Camarca, M.; Siciliano, R.; Oliva, A.

    1990-06-01

    We present a detailed, angle-resolved Si L-shell Auger study by bombarding a single-crystalline Si sample with 10-keV Ar+ ions. We have observed a new atomic line at kinetic energy of ~99 eV which is tentatively assigned to an Auger transition involving two 2p holes in Si+. The existence of two atomic peaks at 61.36 and 91.1 eV has also been clearly confirmed. Our Auger spectra show well-split Doppler peaks for the principal Si0 and Si+ atomic lines and a strong dependence of the shift amplitude on both incidence and detection angles. Successful computer fitting of the angular dependence of Doppler shift has been achieved by using a simple binary-collision model with the Molière approximation to the Thomas-Fermi screening potential. These results suggest that the first violent Ar-Si asymmetric collisions contribute remarkably to the Si 2p-vacancy creation process and are responsible for the ejection of energetic Si(*) particles which is highly directional. The critical minimum Ar-Si approach distance for Si 2p-hole excitation is 0.355 Å, in very good agreement with the value predicted by molecular-orbital theory.

  1. Development of a universal serial bus interface circuit for ion beam current integrators.

    PubMed

    Suresh, K; Panigrahi, B K; Nair, K G M

    2007-08-01

    A universal serial bus (USB) interface circuit has been developed to enable easy interfacing of commercial as well as custom-built ion beam current integrators to personal computer (PC) based automated experimental setups. Built using the popular PIC16F877A reduced instruction set computer and a USB-universal asynchronous receiver-transmitter/first in, first out controller, DLP2232, this USB interface circuit virtually emulates the ion beam current integrators on a host PC and uses USB 2.0 protocol to implement high speed bidirectional data transfer. Using this interface, many tedious and labor intensive ion beam irradiation and characterization experiments can be redesigned into PC based automated ones with advantages of improved accuracy, rapidity, and ease of use and control. This interface circuit was successfully used in carrying out online in situ resistivity measurement of 70 keV O(+) ion irradiated tin thin films using four probe method. In situ electrical resistance measurement showed the formation of SnO(2) phase during ion implantation. PMID:17764373

  2. Design of a beam emission spectroscopy diagnostic for negative ions radio frequency source SPIDER

    SciTech Connect

    Zaniol, B.; Pasqualotto, R.; Barbisan, M.

    2012-04-15

    A facility will be built in Padova (Italy) to develop, commission, and optimize the neutral beam injection system for ITER. The full scale prototype negative ion radio frequency source SPIDER, featuring up to 100 kV acceleration voltage, includes a full set of diagnostics, required for safe operation and to measure and optimize the beam performance. Among them, beam emission spectroscopy (BES) will be used to measure the line integrated beam uniformity, divergence, and neutralization losses inside the accelerator (stripping losses). In the absence of the neutralization stage, SPIDER beam is mainly composed by H{sup -} or D{sup -} particles, according to the source filling gas. The capability of a spectroscopic diagnostic of an H{sup -} (D{sup -}) beam relies on the interaction of the beam particles with the background gas particles. The BES diagnostic will be able to acquire the H{sub {alpha}} (D{sub {alpha}}) spectrum from up to 40 lines of sight. The system is capable to resolve stripping losses down to 2 keV and to measure beam divergence with an accuracy of about 10%. The design of this diagnostic is reported, with discussion of the layout and its components, together with simulations of the expected performance.

  3. Tamped, split fuel-layer ion-beam target

    SciTech Connect

    Meeker, D.J.; Bangerter, R.O.

    1981-01-01

    A double shelled, split fuel layer target with an outer hydro tamper surrounding the low Z absorber has been designed for ion beam drivers. Results from 1-D computer calculations predict a 5 GeV heavy ion beam could produce gains in excess of 200. The behavior of this target as a function of ion range, tamper thickness and spot size has been studied.

  4. Beam-Ion Instability in PEP-II

    SciTech Connect

    Heifets, S.; Kulikov, A.; Wang, Min-Huey; Wienands, U.; /SLAC

    2007-11-07

    The instability in the PEP-II electron ring has been observed while reducing the clearing gap in the bunch train. We study the ion effects in the ring summarizing existing theories of the beam-ion interaction, comparing them with observations, and estimating effect on luminosity in the saturation regime. Considering the gap instability we suggest that the instability is triggered by the beam-ion instability, and discuss other mechanisms pertinent to the instability.

  5. Design and operation of the electron beam ion trap

    SciTech Connect

    Vogel, D.

    1990-05-30

    This report describes the basic features and operating principles of the Electron Beam Ion Trap. The differences between EBIT and other sources of highly charged ions are outlined. Its features and operating parameters are discussed. The report also explains why certain design choices were necessary and the constraints involved in building an electron beam ion trap. EBIT's evaporation cooling system is described in detail. 13 refs., 8 figs.

  6. Low-energy Rutherford backscattering-ion channeling measurement system with the use of several tens keV hydrogen and a time-of-flight spectrometer

    NASA Astrophysics Data System (ADS)

    Hasegawa, Masataka; Kobayashi, Naoto; Hayashi, Nobuyuki

    1996-10-01

    We have developed a low-energy Rutherford backscattering spectrometry (RBS)-ion channeling measurement system for the analysis of thin films and solid surfaces with the use of several tens keV hydrogen ions and a time-of-flight spectrometer which was originally developed by Mendenhall and Weller. The depth resolution of our system is better than that of a conventional RBS system with MeV helium ions and silicon surface barrier detectors. This measurement system is very small in size compared to the conventional RBS-ion channeling measurement system with the use of MeV He ions, because of the small ion accelerator for several tens keV ions. The analysis of crystalline thin films which utilizes ion channeling effect can be performed with the use of this low-energy RBS-ion channeling measurement system. The in situ observation of the thermal reaction between iron and silicon substrate with the use of this measurement system is also demonstrated.

  7. Effect of powerful pulsed and continuous ion beams on the Al- Cu-Mg alloy structure

    NASA Astrophysics Data System (ADS)

    Gushchina, N. V.; Makhin'ko, F. F.; Ovchinnikov, V. V.; Gusel'nikov, V. I.; Remnev, G. E.

    2016-02-01

    The paper considers the results of an electron microscopy study of the VD1 alloy of the Al-Cu-Mg system after cold working and subsequent irradiation with a powerful pulsed ion beam (70% C+ + 30% H+, E = 180 keV) in the pulsed-periodic mode (t = 80 ns, f = 0.1 Hz, j = 200 A/cm2, F = 1-1014 cm-2) and under the conditions of the generation of only one pulse (t = 180 ns, j = 100 A/cm2, F = 2-1015 cm-2). It is established that this irradiation noticeably affects the microstructure of the cold-worked 3 mm thick sheets of VD1 alloy. The initial cellular dislocation structure transforms into a subgrain one. The intensity of structural transformations in the alloy increases with ion current density of a pulse. A similar transformation of a dislocation structure over the entire thickness of the sample is observed under irradiation with continuous Ar+ ion beams (E = 20-40 keV) with not high fluences (1015-1016 cm-2).

  8. Development of a lithium liquid metal ion source for MeV ion beam analysis

    SciTech Connect

    Read, P.M.; Maskrey, J.T.; Alton, G.D.

    1988-01-01

    Lithium liquid metal ion sources are an attractive complement to the existing gaseous ion sources that are extensively used for ion beam analysis. This is due in part to the high brightness of the liquid metal ion source and in part to the availability of a lithium ion beam. High brightness is of particular importance to MeV ion microprobes which are now approaching current density limitations on targets determined by the ion source. The availability of a lithium beam provides increased capabilities for hydrogen profiling and high resolution Rutherford backscattering spectrometry. This paper describes the design and performance of a lithium liquid metal ion source suitable for use on a 5MV Laddertron accelerator. Operational experience with the source and some of its uses for ion beam analysis are discussed. 8 refs., 2 figs.

  9. High-precision hyperfine structure measurement in slow atomic ion beams by collinear laser-rf double resonance

    SciTech Connect

    Amarjit Sen, Childs, W.J.; Goodman, L.S.

    1987-01-01

    A new collinear laser-ion beam apparatus for slow ions (1 to 1.5 keV) has been built for measuring the hyperfine structure of metastable levels of ions with laser-rf double resonance technique. Narrow linewidths of approx.60 kHz (FWHM) have been observed for the first time in such systems. As a first application the hyperfine structure of the 4f/sup 7/(/sup 8/S/sup 0/)5d /sup 9/D/sub J//sup 0/ metastable levels of /sup 151,153/Eu/sup +/ has been measured with high precision. 10 refs., 8 figs.

  10. Area-selective formation of Si nanocrystals by assisted ion-beam irradiation during dual-ion-beam deposition

    SciTech Connect

    Kim, Jae Kwon; Cha, Kyu Man; Kang, Jung Hyun; Kim, Yong; Yi, Jae-Yel; Chung, Tae Hun; Bark, Hong Jun

    2004-08-30

    We investigate the effect of Ar-ion-beam irradiation during the deposition of SiO{sub x} films by dual-ion-beam deposition system. Ion-beam irradiation effectively increases the oxygen content, x, in SiO{sub x} films indicative of the preferential sputtering of Si phase as compared to SiO{sub 2} phase in SiO{sub x} films. We observe the intense photoluminescence from nonirradiated sample after postdeposition annealing at 1100 deg. C indicating the formation of Si nanocrystals as shown by a cross-sectional transmission electron microscope. However, the increased oxygen content in ion-beam-irradiated sample results in small optical volume of small Si nanocrystals not sufficient for yielding appreciable photoluminescence intensity after postdeposition annealing. The property is utilized for achieving the area-selective formation of Si nanocrytals by inserting a shadow mask in assist ion beam during deposition.

  11. Beam extraction and high stability operation of high current electron cyclotron resonance proton ion source

    SciTech Connect

    Roychowdhury, P. Mishra, L.; Kewlani, H.; Mittal, K. C.; Patil, D. S.

    2014-03-15

    A high current electron cyclotron resonance proton ion source is designed and developed for the low energy high intensity proton accelerator at Bhabha Atomic Research Centre. The plasma discharge in the ion source is stabilized by minimizing the reflected microwave power using four stub auto tuner and magnetic field. The optimization of extraction geometry is performed using PBGUNS code by varying the aperture, shape, accelerating gap, and the potential on the electrodes. While operating the source, it was found that the two layered microwave window (6 mm quartz plate and 2 mm boron nitride plate) was damaged (a fine hole was drilled) by the back-streaming electrons after continuous operation of the source for 3 h at beam current of 20–40 mA. The microwave window was then shifted from the line of sight of the back-streaming electrons and located after the water-cooled H-plane bend. In this configuration the stable operation of the high current ion source for several hours is achieved. The ion beam is extracted from the source by biasing plasma electrode, puller electrode, and ground electrode to +10 to +50 kV, −2 to −4 kV, and 0 kV, respectively. The total ion beam current of 30–40 mA is recorded on Faraday cup at 40 keV of beam energy at 600–1000 W of microwave power, 800–1000 G axial magnetic field and (1.2–3.9) × 10{sup −3} mbar of neutral hydrogen gas pressure in the plasma chamber. The dependence of beam current on extraction voltage, microwave power, and gas pressure is investigated in the range of operation of the ion source.

  12. Biophysical models in ion beam radiotherapy

    NASA Astrophysics Data System (ADS)

    Scholz, Michael; Elsässer, Thilo

    One major rationale for the application of heavy ion beams in tumor therapy is their increased relative biological effectiveness (RBE) in the Bragg peak region. For dose prescription, the increased effectiveness has to be taken into account in treatment planning. Hence, the complex dependencies of RBE on the dose level, biological endpoint, position in the field etc. require biophysical models, which have to fulfill two important criteria: simplicity and quantitative precision. Simplicity means that the number of free parameters should be kept at a minimum. Due to the lack of precise quantitative data, at least at present, this requirement is incompatible with approaches aiming at the molecular modeling of the whole chain of production, processing and repair of biological damages. Quantitative precision is required since steep gradients in the dose response curves are observed for most tumor and normal tissues; thus, even small uncertainties in the estimation of the biologically effective dose can transform into large uncertainties in the clinical outcome. The paper will give a general introduction into the field, followed by a description of a specific model, the so called 'Local Effect Model' (LEM). This model has been successfully applied within treatment planning in the GSI pilot project for carbon ion tumor therapy over almost 10 years now. The model is based on the knowledge of charged particle track structure in combination with the response of the cells or tissues under consideration to conventional photon radiation. The model is compared to other approaches developed for the calculation of the biological effects of high-LET radiation. Furthermore, recent improvements of the model are described. Due to the quantitative precision, besides applications in tumor therapy the LEM seems to be adequate for the calculation of stochastic radiation effects, i.e. in the framework of radiation protection. Examples for the calculation of cell transformation are

  13. Flux threshold measurements of nano-fuzz formation by He-ion beam impact on hot tungsten surfaces

    NASA Astrophysics Data System (ADS)

    Meyer, F. W.; Hijazi, H.; Bannnister, M. E.; Garrison, L. M.; Parish, C. M.; Unocic, K. A.

    2015-11-01

    We report measurements of the energy dependence of flux thresholds and incubation fluences for He-ion induced nano-fuzz formation on hot tungsten surfaces using real-time sample imaging of tungsten target emissivity change together with accurate ion-beam flux-profile measurements. The measurements were carried out at the Multicharged Ion Research Facility (MIRF) at ion energies from 218 eV to 8.5 keV, using a high-flux deceleration module and beam flux monitor for optimizing the decel optics on the low energy MIRF beamline. The measurements suggest that nano-fuzz formation proceeds only if a critical rate of change of trapped He density in the W target is exceeded. The energy dependence of three factors contributing to the overall energy dependence, ion reflection, ion range and target damage creation, were determined using the SRIM simulation code. The observed energy dependence can be well reproduced by the combined energy dependences of these three factors. The incubation fluences deduced from first visual appearance of surface emissivity change were 2-4x1023/m2 at 218 eV, and roughly a factor of 10 less at the higher energies, which were all at or above the displacement energy threshold. Additional measurements at 100 and 200 keV, using beams from the MIRF HV-platform-based ECR source will be presented. Research sponsored by the LDRD program at ORNL, managed by UT-Battelle for the USDOE, and by the DOE OFES.

  14. Angular scattering of 1–50 keV ions through graphene and thin carbon foils: Potential applications for space plasma instrumentation

    SciTech Connect

    Ebert, Robert W.; Allegrini, Frédéric; Fuselier, Stephen A.; Nicolaou, Georgios; Physics and Astronomy Department, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249 ; Bedworth, Peter; Sinton, Steve; Trattner, Karlheinz J.; Laboratory for Atmospheric and Space Physics, University of Colorado, 1234 Innovation Drive, Boulder, Colorado 80303

    2014-03-15

    We present experimental results for the angular scattering of ∼1–50 keV H, He, C, O, N, Ne, and Ar ions transiting through graphene foils and compare them with scattering through nominal ∼0.5 μg cm{sup −2} carbon foils. Thin carbon foils play a critical role in time-of-flight ion mass spectrometers and energetic neutral atom sensors in space. These instruments take advantage of the charge exchange and secondary electron emission produced as ions or neutral atoms transit these foils. This interaction also produces angular scattering and energy straggling for the incident ion or neutral atom that acts to decrease the performance of a given instrument. Our results show that the angular scattering of ions through graphene is less pronounced than through the state-of-the-art 0.5 μg cm{sup −2} carbon foils used in space-based particle detectors. At energies less than 50 keV, the scattering angle half width at half maximum, ψ{sub 1/2}, for ∼3–5 atoms thick graphene is up to a factor of 3.5 smaller than for 0.5 μg cm{sup −2} (∼20 atoms thick) carbon foils. Thus, graphene foils have the potential to improve the performance of space-based plasma instruments for energies below ∼50 keV.

  15. Comparison of experimental data and 3D simulations of ion beam neutralization from the neutralized transport experiment

    SciTech Connect

    Thoma, C.; Welch, D.R.; Yu, S.S.; Henestroza, E.; Roy, P.K.; Eylon, S.; Gilson, E.P.

    2004-09-22

    The Neutralized Transport Experiment (NTX) at Lawrence Berkeley National Laboratory has been designed to study the final focus and neutralization of high perveance ion beams for applications in heavy ion fusion (HIF) and high energy density physics (HEDP) experiments. Pre-formed plasmas in the last meter before the target of the scaled experiment provide a source of electrons which neutralize the ion current and prevent the space-charge induced spreading of the beam spot. NTX physics issues are discussed and experimental data is analyzed and compared with 3D particle-in-cell simulations. Along with detailed target images, 4D phase-space data of the NTX at the entrance of the neutralization region has been acquired. This data is used to provide a more accurate beam distribution with which to initialize the simulation. Previous treatments have used various idealized beam distributions which lack the detailed features of the experimental ion beam images. Simulation results are compared with NTX experimental measurements for 250 keV K{sup +} ion beams with dimensionless perveance of 1-7 x 10{sup -4}. In both simulation and experiment, the deduced beam charge neutralization is close to the predicted maximum value.

  16. Method and apparatus for efficient photodetachment and purification of negative ion beams

    DOEpatents

    Beene, James R.; Liu, Yuan; Havener, Charles C.

    2008-02-26

    Methods and apparatus are described for efficient photodetachment and purification of negative ion beams. A method of purifying an ion beam includes: inputting the ion beam into a gas-filled multipole ion guide, the ion beam including a plurality of ions; increasing a laser-ion interaction time by collisional cooling the plurality of ions using the gas-filled multipole ion guide, the plurality of ions including at least one contaminant; and suppressing the at least one contaminant by selectively removing the at least one contaminant from the ion beam by electron photodetaching at least a portion of the at least one contaminant using a laser beam.

  17. The response of a radiation resistant ceramic scintillator (Al{sub 2}O{sub 3}:Cr) to low energy ions (0-60 keV)

    SciTech Connect

    Jimenez-Rey, D.; Zurro, B.; McCarthy, K. J.; Baciero, A.; Garcia, G.

    2008-10-15

    This work extends a previous study on ionoluminescence of a radiation-hard ceramic scintillator, Al{sub 2}O{sub 3}:Cr, to ions accelerated to keV energies [K. J. McCarthy et al., J. Nucl. Mater. 321, 78 (2003)]. It is motivated by the identification of this material as a promising candidate for use in the fast-ion-loss detector for ITER [for the range of thermal (low energy) and suprathermal ions]. In the paper we quantify and compare its ionoluminescence with that of some common luminescent materials (YAG:Ce and ruby) when irradiated by H{sup +} ions accelerated to {<=}60 keV using a purpose built laboratory setup. Next, studies are made on the ceramic to quantify its response as a function of incident ion mass, i.e., to He{sup +}. For this, the absolute luminosities of the material are estimated in terms of the number of photons emitted per incident ion as a function of energy. Moreover, the radiation hardness and postirradiation recovery of the ceramic are investigated. Finally, from the studies it can be concluded that the ceramic ruby is a good candidate for detecting low energy ions as long as its temporal response (approximately several milliseconds) is not a constraint for specific ion measurements.

  18. Focusing of high-current, large-area, heavy-ion beams with an electrostatic plasma lens

    SciTech Connect

    Goncharov, A.A.; Protsenko, I.M.; Yushkov, G.Y.; Brown, I.G.

    1999-08-01

    We report on measurements of the focusing of high-current, large-area beams of heavy metal ions using an electrostatic plasma lens. Tantalum ion beams were formed by a repetitively pulsed vacuum arc ion source, with energy in the 100 keV range, current up to 0.5 A, initial beam diameter 10 cm, and pulse length 250 {mu}s. The plasma lens was of internal diameter 10 cm and length 20 cm, and had nine electrostatic ring electrodes with potential applied to the central electrode of up to 7 kV, in the presence of a pulsed magnetic field of up to 800 G. The current-density profile of the downstream, focused, ion beam was measured with a radially moveable, magnetically suppressed, Faraday cup. The tantalum ion-beam current density at the focus was compressed by a factor of up to 30. The results are important in that they provide a demonstration of a means of manipulating high-current ion beams without associated space-charge blowup. {copyright} {ital 1999 American Institute of Physics.}

  19. High intensity ion beam injection into the 88-inch cyclotron

    SciTech Connect

    Wutte, Daniela; Clark, Dave J.; Laune, Bernard; Leitner,Matthaeus A.; Lyneis, Claude M.

    2000-05-31

    Low cross section experiments to produce super-heavyelements have increased the demand for high intensity heavy ion beams atenergies of about 5 MeV/nucleon at the 88-Inch Cyclotron at the LawrenceBerkeley National Laboratory. Therefore, efforts are underway to increasethe overall ion beam transmission through the axial injection line andthe cyclotron. The ion beam emittance has been measured for various ionmasses and charge states. Beam transport simulations including spacecharge effects were performed for both of the injection line and the ionsource extraction. The relatively low nominal injection voltage of 10 kVwas found to be the main factor for ion beam losses, because of beam blowup due to space charge forces at higher intensities. Consequently,experiments and simulations have been performed at higherinjectionenergies, and it was demonstrated that the ion beams could still becentered in the cyclotron at these energies. Therefore, the new injectorion source VENUS and its ion beam transport system (currently underconstruction at the 88-Inch Cyclotron) are designed for extractionvoltages up to 30 kV.

  20. Plasma focus ion beam fluence and flux--Scaling with stored energy

    NASA Astrophysics Data System (ADS)

    Lee, S.; Saw, S. H.

    2012-11-01

    Measurements on plasma focus ion beams include various advanced techniques producing a variety of data which has yet to produce benchmark numbers [A Bernard et al., J. Mosc. Phys. Soc. 8, 93-170 (1998)]. This present paper uses the Lee Model code [S Lee, http://www.plasmafocus.net (2012)], integrated with experimental measurements to provide the basis for reference numbers and the scaling of deuteron beams versus stored energy E0. The ion number fluence (ions m-2) and energy fluence (J m-2) computed as 2.4-7.8 × 1020 and 2.2-33 × 106, respectively, are found to be independent of E0 from 0.4 to 486 kJ. Typical inductance machines (33-55 nH) produce 1.2-2 × 1015 ions per kJ carrying 1.3%-4% E0 at mean ion energy 50-205 keV, dropping to 0.6 × 1015 ions per kJ carrying 0.7% E0 for the high inductance INTI PF.

  1. The generation and application of intense pulsed ion beams

    NASA Astrophysics Data System (ADS)

    Golden, J.; Kapetanakos, C. A.; Pasour, J. A.; Mahaffey, R. A.

    1981-04-01

    Means for the generation of pulsed, ultrahigh power beams of low-atomic-mass ions are considered, and potential applications of the beams in thermonuclear fusion and other applications are discussed. The intense ion beam sources represent an extension of the pulsed-power technology of relativistic electron beams, employing transmission lines powered by Marx generators to produce pulses of 25-100 nsec duration, energies of 0.1-2 MV, currents of 1 kA to 1 MA, and power levels above 1 GW. The most successful approach to intense pulsed beam generation is based on the acceleration of plasma ions within vacuum-diode-like sources involving the processes of plasma generation, ion extraction, and the suppression of the electron current, which may be accomplished by reflexing, pinching or magnetic insulation. Ion beams thus generated have been used to form transient, field-reversed ion layers and to excite high-power gas lasers. Intense ion beams are also under investigation as drivers of inertial confinement in thermonuclear reactors.

  2. Expansion Discharge Source for Ion Beam Laser Spectroscopy of Cold Molecular Ions

    NASA Astrophysics Data System (ADS)

    Porambo, Michael; Pearson, Jessica; Riccardo, Craig; McCall, Benjamin J.

    2013-06-01

    Molecular ions are important in several fields of research, and spectroscopy acts as a key tool in the study of these ions. However, problems such as low ion abundance, ion-neutral confusion, and spectral congestion due to high internal temperatures can hinder effective spectroscopic studies. To circumvent these problems, we are developing a technique called Sensitive, Cooled, Resolved, Ion BEam Spectroscopy (SCRIBES). This ion beam spectrometer will feature a continuous supersonic expansion discharge source to produce cold molecular ions, electrostatic ion optics to focus the ions into an ion beam and bend the beam away from co-produced neutral molecules, an overlap region for cavity enhanced spectroscopy, and a time-of-flight mass spectrometer. When completed, SCRIBES will be an effective tool for the study of large, fluxional, and complex molecular ions that are difficult to study with other means. The ion beam spectrometer has been successfully implemented with a hot ion source. This talk will focus on the work of integrating a supersonic expansion discharge source into the instrument. To better understand how the source would work in the whole ion beam instrument, characterization studies are being performed with spectroscopy of HN_2^+ in a section of the system to ascertain the rotational temperature of the ion expansion. Attempts are also underway to measure the ion current from a beam formed from the expansion. Once the source in this environment is properly understood, we will reintegrate it to the rest of the ion beam system, completing SCRIBES. A. A. Mills, B. M. Siller, M. W. Porambo, M. Perera, H. Kreckel and B. J. McCall J. Chem. Phys., 135, 224201, (2011). K. N. Crabtree, C. A. Kauffman and B. J. McCall Rev. Sci. Instrum. 81, 086103, (2010).

  3. Development of the 3D Parallel Particle-In-Cell Code IMPACT to Simulate the Ion Beam Transport System of VENUS (Abstract)

    NASA Astrophysics Data System (ADS)

    Qiang, J.; Leitner, D.; Todd, D. S.; Ryne, R. D.

    2005-03-01

    The superconducting ECR ion source VENUS serves as the prototype injector ion source for the Rare Isotope Accelerator (RIA) driver linac. The RIA driver linac requires a great variety of high charge state ion beams with up to an order of magnitude higher intensity than currently achievable with conventional ECR ion sources. In order to design the beam line optics of the low energy beam line for the RIA front end for the wide parameter range required for the RIA driver accelerator, reliable simulations of the ion beam extraction from the ECR ion source through the ion mass analyzing system are essential. The RIA low energy beam transport line must be able to transport intense beams (up to 10 mA) of light and heavy ions at 30 keV. For this purpose, LBNL is developing the parallel 3D particle-in-cell code IMPACT to simulate the ion beam transport from the ECR extraction aperture through the analyzing section of the low energy transport system. IMPACT, a parallel, particle-in-cell code, is currently used to model the superconducting RF linac section of RIA and is being modified in order to simulate DC beams from the ECR ion source extraction. By using the high performance of parallel supercomputing we will be able to account consistently for the changing space charge in the extraction region and the analyzing section. A progress report and early results in the modeling of the VENUS source will be presented.

  4. High-Speed Nano-Processing with Cluster Ion Beams

    NASA Astrophysics Data System (ADS)

    Seki, T.; Matsuo, J.

    2006-11-01

    The gas cluster ion beam process has a high potential for material processing in nano-technology devices, such as photonic crystals, thin film transistors (TFTs) and micro-electromechanical systems (MEMS). In order to fabricate the devices, one needs to etch target materials with a high-speed, low-damage and ultra-smooth process. Extremely high rate sputtering was realized by high-energy cluster ion beam. We have been using this technique for poly-Si TFTs. There are many hillocks on poly-Si films formed by using a laser anneal technique, and they cause degradation of devices. When the laser crystallized poly-Si film was irradiated with cluster ion beam, the higher hillocks could be etched selectively and the surfaces of poly-Si films could be processed with low ion dose. High-speed nano-processing was realized by cluster ion beam.

  5. Ion beam collimating grid to reduce added defects

    DOEpatents

    Lindquist, Walter B.; Kearney, Patrick A.

    2003-01-01

    A collimating grid for an ion source located after the exit grid. The collimating grid collimates the ion beamlets and disallows beam spread and limits the beam divergence during transients and steady state operation. The additional exit or collimating grid prevents beam divergence during turn-on and turn-off and prevents ions from hitting the periphery of the target where there is re-deposited material or from missing the target and hitting the wall of the vessel where there is deposited material, thereby preventing defects from being deposited on a substrate to be coated. Thus, the addition of a collimating grid to an ion source ensures that the ion beam will hit and be confined to a specific target area.

  6. Neutralization tests on the SERT II spacecraft. [of ion beams

    NASA Technical Reports Server (NTRS)

    Kerslake, W. R.; Domitz, S.

    1979-01-01

    Orbit precession returned the SERT II spacecraft to continuous sunlight in January 1979 for the first time since early 1972, and new experiments were planned and conducted. Neutralization of an ion beam was accomplished by a second neutralizer cathode located 1 meter away. Plasma potential measurements were made of the plasma surrounding the ion beam and connecting the beam to the second neutralizer. When the density of the connecting plasma was increased by turning on the main discharge of a neighboring ion thruster, the neutralization of the ion beam occurred with improved (lower) coupling voltage. These and other tests reported should aid in the future design of spacecraft using electric thruster systems. Data taken indicate that cross neutralization of ion thrusters in a multiple thruster array should occur readily.

  7. Space Charge Neutralization in the ITER Negative Ion Beams

    SciTech Connect

    Surrey, Elizabeth

    2007-08-10

    A model of the space charge neutralization of negative ion beams, developed from the model due to Holmes, is applied to the ITER heating and diagnostic beams. The Holmes model assumed that the plasma electron temperature was derived from the stripped electrons. This is shown to be incorrect for the ITER beams and the plasma electron temperature is obtained from the average creation energy upon ionization. The model shows that both ITER beams will be fully space charge compensated in the drift distance between the accelerator and the neutralizer. Inside the neutralizer, the plasma over compensates the space charge to the extent that a significant focusing force is predicted. At a certain position in the neutraliser this force balances the defocusing force due to the ions' transverse energy. Under these conditions the beam distribution function can change from Gaussian to Bennett and evidence of such a distribution observed in a multi-aperture, neutralized negative ion beam is presented.

  8. Production of a highly charged uranium ion beam with RIKEN superconducting electron cyclotron resonance ion source

    SciTech Connect

    Higurashi, Y.; Ohnishi, J.; Nakagawa, T.; Haba, H.; Fujimaki, M.; Komiyama, M.; Kamigaito, O.; Tamura, M.; Aihara, T.; Uchiyama, A.

    2012-02-15

    A highly charged uranium (U) ion beam is produced from the RIKEN superconducting electron cyclotron resonance ion source using 18 and 28 GHz microwaves. The sputtering method is used to produce this U ion beam. The beam intensity is strongly dependent on the rod position and sputtering voltage. We observe that the emittance of U{sup 35+} for 28 GHz microwaves is almost the same as that for 18 GHz microwaves. It seems that the beam intensity of U ions produced using 28 GHz microwaves is higher than that produced using 18 GHz microwaves at the same Radio Frequency (RF) power.

  9. Preliminary result of rapid solenoid for controlling heavy-ion beam parameters of laser ion source

    DOE PAGESBeta

    Okamura, M.; Sekine, M.; Ikeda, S.; Kanesue, T.; Kumaki, M.; Fuwa, Y.

    2015-03-13

    To realize a heavy ion inertial fusion driver, we have studied a possibility of laser ion source (LIS). A LIS can provide high current high brightness heavy ion beams, however it was difficult to manipulate the beam parameters. To overcome the issue, we employed a pulsed solenoid in the plasma drift section and investigated the effect of the solenoid field on singly charged iron beams. The rapid ramping magnetic field could enhance limited time slice of the current and simultaneously the beam emittance changed accordingly. This approach may also useful to realize an ion source for HIF power plant.

  10. Effects of Prenatal Irradiation with an Accelerated Heavy-Ion Beam on Postnatal Development in Rats

    NASA Astrophysics Data System (ADS)

    Wang, B.; Murakami, M.; Eguchi-Kasai, K.; Nojima, K.; Shang, Y.; Tanaka, K.; Fujita, K.; Coffigny, H.; Hayata, I.

    Effects on postnatal neurophysiological development in offspring were studied following exposure of pregnant Wistar rats to accelerated neon-ion beams with a LET value of about 30 keV mu m at a dose range from 0 1 Gy to 2 0Gy on the 15th day of gestation The age at which four physiologic markers appeared and five reflexes were acquired was examined prior to weaning Gain in body weight was monitored until the offspring were 3 months old Male offspring were evaluated as young adults using two behavioral tests The effects of X-rays at 200 kVp measured for the same biological end points were studied for comparison Our previous study on carbon-ion beams with a LET value of about 13 keV mu m was also cited to elucidate a possible LET-related effect For most of the endpoints at early age significant alteration was even observed in offspring prenatally received 0 1 Gy of accelerated neon ions while neither X rays nor carbon-ions under the same dose resulted in such a significant alteration compared to that from the sham-irradiated dams All offspring whose mothers received 2 0 Gy died prior to weaning Offspring from dams irradiated with accelerated neon ions generally showed higher incidences of prenatal death and preweaning mortality markedly delayed accomplishment in their physiological markers and reflexes and gain in body weight compared to those exposed to X-rays or carbon ions at doses of 0 1 to 1 5 Gy Significantly reduced ratios of main organ weight to body weight at postnatal ages of 30 60 and 90 days were also observed

  11. Characterization of the Ion Beam Focusing in a Mass Spectrometer using an IonCCD™ Detector

    SciTech Connect

    Johnson, Grant E.; Hadjar, Omar; Laskin, Julia

    2011-07-26

    A position sensitive pixel-based detector array, referred to as the IonCCDTM, has been employed to characterize the ion optics and ion beam focusing in a custom built mass spectrometer designed for soft and reactive landing of mass-selected ions onto surfaces. The IonCCDTM was placed at several stages along the path of the ion beam to determine the focusing capabilities of the various ion optics which include an electrodynamic ion funnel, two radiofrequency (RF) only collision quadrupoles, a mass resolving quadrupole, a quadrupole bender, and two Einzel lens assemblies. The focusing capabilities of the RF-only collision quadrupoles and Einzel lenses are demonstrated by large decreases in the diameter of the ion beam. In contrast, the mass resolving quadrupole is shown to significantly defocus the mass-selected ion beam resulting in an expansion of the measured ion beam diameter. Combined with SIMION simulations we demonstrate that the IonCCDTM can identify minor errors in the alignment of charged-particle optics that result in erratic trajectories and significant deflections of the ion beam.. This information can be used to improve the design assembly and maintenance of custom-built mass spectrometry instrumentation.

  12. Characterization of the ion beam focusing in a mass spectrometer using an IonCCD™ detector.

    PubMed

    Johnson, Grant E; Hadjar, Omar; Laskin, Julia

    2011-08-01

    A position sensitive pixel-based detector array, referred to as the IonCCD, has been employed to characterize the ion optics and ion beam focusing in a custom built mass spectrometer designed for soft and reactive landing of mass-selected ions onto surfaces. The IonCCD was placed at several stages along the path of the ion beam to determine the focusing capabilities of the various ion optics, which include an electrodynamic ion funnel, two radiofrequency (rf)-only collision quadrupoles, a mass resolving quadrupole, a quadrupole bender, and two einzel lens assemblies. The focusing capabilities of the rf-only collision quadrupoles and einzel lenses are demonstrated by large decreases in the diameter of the ion beam. In contrast, the mass resolving quadrupole is shown to significantly defocus the mass-selected ion beam resulting in an expansion of the measured ion beam diameter. Combined with SIMION simulations, we demonstrate that the IonCCD can identify minor errors in the alignment of charged-particle optics that result in erratic trajectories and significant deflections of the ion beam. This information may be used to facilitate the design, assembly, and maintenance of custom-built mass spectrometry instrumentation. PMID:21953193

  13. Spontaneous ion beam formation in the laboratory, space, and simulation

    SciTech Connect

    Carr, J. Jr.; Cassak, P. A.; Galante, M.; Keesee, A. M.; Lusk, G.; Magee, R. M.; McCarren, D.; Scime, E. E.; Sears, S.; Vandervort, R.; Gulbrandsen, N.; Goldman, Martin; Newman, David; Eastwood, J. P.

    2013-07-15

    We present experimental evidence for the spontaneous formation of multiple double layers within a single divergent magnetic field structure. Downstream of the divergent magnetic field, multiple accelerated ion populations are observed. The similarity of the accelerated ion populations observed in these laboratory experiments to ion populations observed in the magnetosphere and in numerical simulations suggests that the observation of a complex ion velocity distribution alone is insufficient to distinguish between simple plasma expansion and magnetic reconnection. Further, the effective temperature of the aggregate ion population is significantly larger than the temperatures of the individual ion population components, suggesting that insufficiently resolved measurements could misidentify multiple beam creation as ion heating. Ions accelerated in randomly oriented electric fields that mimic heating would have an ion heating rate dependent on the ion charge and mass that is qualitatively consistent with recent experimental observations of ion heating during magnetic reconnection.

  14. High current H- ion sources for the large helical device neutral beam injector

    NASA Astrophysics Data System (ADS)

    Oka, Y.; Tsumori, K.; Takeiri, Y.; Kaneko, O.; Osakabe, M.; Asano, E.; Kawamoto, T.; Akiyama, R.

    1998-02-01

    Two large helical device-neutral beam injector (LHD-NBI) ion sources were fabricated and tested in the test stand for producing a beam of 180 keV×40 A with H- ions. They are Cesiated multicusp ion sources with a rectangular discharge chamber and a single stage multihole accelerator. These are scaled up from the 16 A H- ion sources in the National Institute for Fusion Science (NIFS). A plasma source with a high aspect ratio was operated stably with an arc power up to ˜300 kW for 10 s, after balancing of the electron emission from the filaments was made. A satisfactorily dense and uniform plasma without mode flip was produced. Electrons accompanied by H- ions were reduced by an extraction grid with the electron trap, instead of straight holes. The electron beam component caused by the stripping of electrons from H- ions was detected with an array of calorimeters at the bottom of the connecting duct. At the first stage of the test, one of the five segment grids of the accelerator was installed. An H- ion current of 5.5 A with a current density of 27.5 mA/cm2 for 0.6 s was obtained with an arc power of 135 kW with Cs introduction. A high arc power efficiency for H- ions was observed. The intense cusp field is considered to be the important factor to improve this. The beam divergence angle at 10.4 m downstream was ˜10 mrad. Since these results satisfied our design, a full segment accelerator was tested in the next stage. Beam conditioning for five segment grids is underway. So far, an H- current of 21.0 A has been obtained at 106 keV for 0.6 s. As a result, we had good prospects for achieving the full specification of LHD-NBI ion sources, especially for achieving higher current and focused beam as well as for long pulse. The neutral beam injection experiment for the LHD is scheduled to start in the middle of 1998.

  15. Verification of high efficient broad beam cold cathode ion source.

    PubMed

    Abdel Reheem, A M; Ahmed, M M; Abdelhamid, M M; Ashour, A H

    2016-08-01

    An improved form of cold cathode ion source has been designed and constructed. It consists of stainless steel hollow cylinder anode and stainless steel cathode disc, which are separated by a Teflon flange. The electrical discharge and output characteristics have been measured at different pressures using argon, nitrogen, and oxygen gases. The ion exit aperture shape and optimum distance between ion collector plate and cathode disc are studied. The stable discharge current and maximum output ion beam current have been obtained using grid exit aperture. It was found that the optimum distance between ion collector plate and ion exit aperture is equal to 6.25 cm. The cold cathode ion source is used to deposit aluminum coating layer on AZ31 magnesium alloy using argon ion beam current which equals 600 μA. Scanning electron microscope and X-ray diffraction techniques used for characterizing samples before and after aluminum deposition. PMID:27587108

  16. Verification of high efficient broad beam cold cathode ion source

    NASA Astrophysics Data System (ADS)

    Abdel Reheem, A. M.; Ahmed, M. M.; Abdelhamid, M. M.; Ashour, A. H.

    2016-08-01

    An improved form of cold cathode ion source has been designed and constructed. It consists of stainless steel hollow cylinder anode and stainless steel cathode disc, which are separated by a Teflon flange. The electrical discharge and output characteristics have been measured at different pressures using argon, nitrogen, and oxygen gases. The ion exit aperture shape and optimum distance between ion collector plate and cathode disc are studied. The stable discharge current and maximum output ion beam current have been obtained using grid exit aperture. It was found that the optimum distance between ion collector plate and ion exit aperture is equal to 6.25 cm. The cold cathode ion source is used to deposit aluminum coating layer on AZ31 magnesium alloy using argon ion beam current which equals 600 μA. Scanning electron microscope and X-ray diffraction techniques used for characterizing samples before and after aluminum deposition.

  17. Note: High density pulsed molecular beam for cold ion chemistry

    SciTech Connect

    Kokish, M. G.; Rajagopal, V.; Marler, J. P.; Odom, B. C.

    2014-08-15

    A recent expansion of cold and ultracold molecule applications has led to renewed focus on molecular species preparation under ultrahigh vacuum conditions. Meanwhile, molecular beams have been used to study gas phase chemical reactions for decades. In this paper, we describe an apparatus that uses pulsed molecular beam technology to achieve high local gas densities, leading to faster reaction rates with cold trapped ions. We characterize the beam's spatial profile using the trapped ions themselves. This apparatus could be used for preparation of molecular species by reactions requiring excitation of trapped ion precursors to states with short lifetimes or for obtaining a high reaction rate with minimal increase of background chamber pressure.

  18. Heavy ion beam transport and interaction with ICF targets

    NASA Astrophysics Data System (ADS)

    Velarde, G.; Aragonés, J. M.; Gago, J. A.; Gámez, L.; González, M. C.; Honrubia, J. J.; Martínez-Val, J. M.; Mínguez, E.; Ocaña, J. L.; Otero, R.; Perlado, J. M.; Santolaya, J. M.; Serrano, J. F.; Velarde, P. M.

    1986-01-01

    Numerical simulation codes provide an essential tool for analyzing the very broad range of concepts and variables considered in ICF targets. In this paper, the relevant processes embodied in the NORCLA code, needed to simulate ICF targets driven by heavy ion beams will be presented. Atomic physic models developed at DENIM to improve the atomic data needed for ion beam plasma interaction will be explained. Concerning the stopping power, the average ionization potential following a Thomas-Fermi model has been calculated, and results are compared with full quantum calculations. Finally, a parametric study of multilayered single shell targets driven by heavy ion beams will be shown.

  19. Polarization Studies in Fast-Ion Beam Spectroscopy

    SciTech Connect

    Trabert, E

    2001-12-20

    In a historical review, the observations and the insight gained from polarization studies of fast ions interacting with solid targets are presented. These began with J. Macek's recognition of zero-field quantum beats in beam-foil spectroscopy as indicating alignment, and D.G. Ellis' density operator analysis that suggested the observability of orientation when using tilted foils. Lastly H. Winter's studies of the ion-beam surface interaction at grazing incidence yielded the means to produce a high degree of nuclear orientation in ion beams.

  20. Xenon ion beam characterization in a helicon double layer thruster

    SciTech Connect

    Charles, C.; Boswell, R. W.; Lieberman, M. A.

    2006-12-25

    A current-free electric double layer is created in a helicon double layer thruster operating with xenon and compared to a recently developed theory. The Xe{sup +} ion beam formed by acceleration through the potential drop of the double layer is characterized radially using an electrostatic ion energy analyzer. For operating conditions of 500 W rf power, 0.07 mTorr gas pressure, and a maximum magnetic field of 125 G, the measured beam velocity is about 6 km s{sup -1}, the beam area is about 150 cm{sup 2}, and the measured beam divergence is less than 6 deg.