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Sample records for multicomponent ion beams

  1. Losses of ion energy in the multicomponent beam

    NASA Astrophysics Data System (ADS)

    Gasanov, Ilkham S.; Gurbanov, Ilgar I.; Akbarov, Elchin M.

    2015-03-01

    Energy losses of near axis ions and decreases in ion current density in the center of a beam were observed in a liquid metal source operating under a charged nanodroplets (In, Sn, Au, Ge) generation regime. In experiments, nanodroplets with the sizes of 2-20 nanometers and a characteristic specific charge of 5 × 104 C/kg were revealed. Energy spectra of ions were defined by means of the filter of speeds with cross-section static electromagnetic fields. A reduction of 4% of the In+ ions energy was observed under the conditions of the curried out measurements. The stream of nanoparticles, in contrast to an ion beam, has a small radial divergence; outside of this stream, change of ion speeds is not observed. Energy losses of ions occur during their flight through small nanoparticles. Penetration depth of the accelerated ions in liquid indium is estimated within the framework of the Lindhard-Scharff-Schiott model. Similar interaction between components occurs in ion-beam systems of complex composition where there is a relative movement of various charged particles.

  2. Ion beam-based characterization of multicomponent oxide thin films and thin film layered structures

    SciTech Connect

    Krauss, A.R.; Rangaswamy, M.; Lin, Yuping; Gruen, D.M.; Schultz, J.A.; Schmidt, H.K.; Chang, R.P.H.

    1992-11-01

    Fabrication of thin film layered structures of multi-component materials such as high temperature superconductors, ferroelectric and electro-optic materials, and alloy semiconductors, and the development of hybrid materials requires understanding of film growth and interface properties. For High Temperature Superconductors, the superconducting coherence length is extremely short (5--15 {Angstrom}), and fabrication of reliable devices will require control of film properties at extremely sharp interfaces; it will be necessary to verify the integrity of thin layers and layered structure devices over thicknesses comparable to the atomic layer spacing. Analytical techniques which probe the first 1--2 atomic layers are therefore necessary for in-situ characterization of relevant thin film growth processes. However, most surface-analytical techniques are sensitive to a region within 10--40 {Angstrom} of the surface and are physically incompatible with thin film deposition and are typically restricted to ultra high vacuum conditions. A review of ion beam-based analytical methods for the characterization of thin film and multi-layered thin film structures incorporating layers of multicomponent oxides is presented. Particular attention will be paid to the use of time-of-flight techniques based on the use of 1- 15 key ion beams which show potential for use as nondestructive, real-time, in-situ surface diagnostics for the growth of multicomponent metal and metal oxide thin films.

  3. Ion beam deposition and surface characterization of thin multi-component oxide films during growth.

    SciTech Connect

    Krauss, A.R.; Im, J.; Smentkowski, V.; Schultz, J.A.; Auciello, O.; Gruen, D.M.; Holocek, J.; Chang, R.P.H.

    1998-01-13

    Ion beam deposition of either elemental targets in a chemically active gas such as oxygen or nitrogen, or of the appropriate oxide or nitride target, usually with an additional amount of ambient oxygen or nitrogen present, is an effective means of depositing high quality oxide and nitride films. However, there are a number of phenomena which can occur, especially during the production of multicomponent films such as the ferroelectric perovskites or high temperature superconducting oxides, which make it desirable to monitor the composition and structure of the growing film in situ. These phenomena include thermodynamic (Gibbsian), and oxidation or nitridation-driven segregation, enhanced oxidation or nitridation through production of a highly reactive gas phase species such as atomic oxygen or ozone via interaction of the ion beam with the target, and changes in the film composition due to preferential sputtering of the substrate via primary ion backscattering and secondary sputtering of the film. Ion beam deposition provides a relatively low background pressure of the sputtering gas, but the ambient oxygen or nitrogen required to produce the desired phase, along with the gas burden produced by the ion source, result in a background pressure which is too high by several orders of magnitude to perform in situ surface analysis by conventional means. Similarly, diamond is normally grown in the presence of a hydrogen atmosphere to inhibit the formation of the graphitic phase.

  4. Generation of multicomponent ion beams by a vacuum arc ion source with compound cathode

    SciTech Connect

    Savkin, K. P.; Yushkov, Yu. G.; Nikolaev, A. G.; Oks, E. M.; Yushkov, G. Yu.

    2010-02-15

    This paper presents the results of time-of-flight mass spectrometry studies of the elemental and mass-to-charge state compositions of metal ion beams produced by a vacuum arc ion source with compound cathode (WC-Co{sub 0.5}, Cu-Cr{sub 0.25}, Ti-Cu{sub 0.1}). We found that the ion beam composition agrees well with the stoichiometric composition of the cathode material from which the beam is derived, and the maximum ion charge state of the different plasma components is determined by the ionization capability of electrons within the cathode spot plasma, which is common to all components. The beam mass-to-charge state spectrum from a compound cathode features a greater fraction of multiply charged ions for those materials with lower electron temperature in the vacuum arc cathode spot, and a smaller fraction for those with higher electron temperature within the spot. We propose a potential diagram method for determination of attainable ion charge states for all components of the compound cathodes.

  5. Generation of multicomponent ion beams by a vacuum arc ion source with compound cathode.

    PubMed

    Savkin, K P; Yushkov, Yu G; Nikolaev, A G; Oks, E M; Yushkov, G Yu

    2010-02-01

    This paper presents the results of time-of-flight mass spectrometry studies of the elemental and mass-to-charge state compositions of metal ion beams produced by a vacuum arc ion source with compound cathode (WC-Co(0.5), Cu-Cr(0.25), Ti-Cu(0.1)). We found that the ion beam composition agrees well with the stoichiometric composition of the cathode material from which the beam is derived, and the maximum ion charge state of the different plasma components is determined by the ionization capability of electrons within the cathode spot plasma, which is common to all components. The beam mass-to-charge state spectrum from a compound cathode features a greater fraction of multiply charged ions for those materials with lower electron temperature in the vacuum arc cathode spot, and a smaller fraction for those with higher electron temperature within the spot. We propose a potential diagram method for determination of attainable ion charge states for all components of the compound cathodes. PMID:20192356

  6. Multicomponent liquid ion exchange with chabazite zeolites

    SciTech Connect

    Robinson, S.M.; Arnold, W.D. Jr.; Byers, C.W.

    1993-10-01

    In spite of the increasing commercial use of zeolites for binary and multicomponent sorption, the understanding of the basic mass-transfer processes associated with multicomponent zeolite ion-exchange systems is quite limited. This study was undertaken to evaluate Na-Ca-Mg-Cs-Sr ion exchange from an aqueous solution using a chabazite zeolite. Mass-transfer coefficients and equilibrium equations were determined from experimental batch-reactor data for single and multicomponent systems. The Langmuir isotherm was used to represent the equilibrium relationship for binary systems, and a modified Dubinin-Polyani model was used for the multicomponent systems. The experimental data indicate that diffusion through the microporous zeolite crystals is the primary diffusional resistance. Macropore diffusion also significantly contributes to the mass-transfer resistance. Various mass-transfer models were compared to the experimental data to determine mass-transfer coefficients. Effective diffusivities were obtained which accurately predicted experimental data using a variety of models. Only the model which accounts for micropore and macropore diffusion occurring in series accurately predicted multicomponent data using single-component diffusivities. Liquid and surface diffusion both contribute to macropore diffusion. Surface and micropore diffusivities were determined to be concentration dependent.

  7. Ion Beam Propulsion Study

    NASA Technical Reports Server (NTRS)

    2008-01-01

    The Ion Beam Propulsion Study was a joint high-level study between the Applied Physics Laboratory operated by NASA and ASRC Aerospace at Kennedy Space Center, Florida, and Berkeley Scientific, Berkeley, California. The results were promising and suggested that work should continue if future funding becomes available. The application of ion thrusters for spacecraft propulsion is limited to quite modest ion sources with similarly modest ion beam parameters because of the mass penalty associated with the ion source and its power supply system. Also, the ion source technology has not been able to provide very high-power ion beams. Small ion beam propulsion systems were used with considerable success. Ion propulsion systems brought into practice use an onboard ion source to form an energetic ion beam, typically Xe+ ions, as the propellant. Such systems were used for steering and correction of telecommunication satellites and as the main thruster for the Deep Space 1 demonstration mission. In recent years, "giant" ion sources were developed for the controlled-fusion research effort worldwide, with beam parameters many orders of magnitude greater than the tiny ones of conventional space thruster application. The advent of such huge ion beam sources and the need for advanced propulsion systems for exploration of the solar system suggest a fresh look at ion beam propulsion, now with the giant fusion sources in mind.

  8. Broad beam ion implanter

    DOEpatents

    Leung, Ka-Ngo

    1996-01-01

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes.

  9. Broad beam ion implanter

    DOEpatents

    Leung, K.N.

    1996-10-08

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes. 6 figs.

  10. Intense ion beam generator

    DOEpatents

    Humphries, Jr., Stanley; Sudan, Ravindra N.

    1977-08-30

    Methods and apparatus for producing intense megavolt ion beams are disclosed. In one embodiment, a reflex triode-type pulsed ion accelerator is described which produces ion pulses of more than 5 kiloamperes current with a peak energy of 3 MeV. In other embodiments, the device is constructed so as to focus the beam of ions for high concentration and ease of extraction, and magnetic insulation is provided to increase the efficiency of operation.

  11. Ion beam thruster shield

    NASA Technical Reports Server (NTRS)

    Power, J. L. (Inventor)

    1976-01-01

    An ion thruster beam shield is provided that comprises a cylindrical housing that extends downstream from the ion thruster and a plurality of annular vanes which are spaced along the length of the housing, and extend inwardly from the interior wall of the housing. The shield intercepts and stops all charge exchange and beam ions, neutral propellant, and sputter products formed due to the interaction of beam and shield emanating from the ion thruster outside of a fixed conical angle from the thruster axis. Further, the shield prevents the sputter products formed during the operation of the engine from escaping the interior volume of the shield.

  12. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, G. (Inventor)

    1981-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids with multiple pairs of aligned holes positioned to direct a group of beamlets along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam. An accelerator electrode device downstream from the extraction grids is at a much lower potential than the grids to accelerate the combined beam. The application of the system to ion implantation is mentioned.

  13. Transverse ion heating in multicomponent plasmas. [in ionosphere

    NASA Technical Reports Server (NTRS)

    Ashour-Abdalla, M.; Okuda, H.; Kim, S. Y.

    1987-01-01

    A new mechanism is proposed for plasma modes which can occur only in a multicomponent plasma and not in pure electron-ion plasma. The addition of ions creates a new instability near the ion-ion hybrid mode whose frequency is adequate for the wave to interact with oxygen ions. To study heating of ions (such as ionospheric oxygen ions) in presence of auroral electrons, several numerical simulations were carried out using a one-dimensional electrostatic code in a magnetic field. It was found that in the presence of electrons drifting along auroral field lines into the ionosphere, the ion-ion hybrid mode can be driven unstable when the electron drift speed is too small to excite the lower hybrid instability. Since the ion-ion mode has a smaller frequency than that of the lower hybrid waves, it can couple to the heavy ions, resulting in a substantial heating of heavy ions; on the other hand, because of their frequencies, the lower hybrid waves can accelerate only light ion species.

  14. Ion beam surface modification

    NASA Technical Reports Server (NTRS)

    Dwight, D. W.

    1982-01-01

    The essential details of a study on the practical applications and mechanisms of polymer sputtering via Argon ion impact are summarized. The potential to modify the properties of polymer surfaces to improve their adherence, durability, biocompatibility, or other desirable properties by ion beam sputtering was emphasized. Ion beam milling can be of benefit as an analytical tool to obtain composition versus depth information. Ion impact from a directed ion gun source specifically etches polymer structures according to their morphologies, therefore this technique may be useful to study unknown or new morphological features. Factors addressed were related to: (1) the texture that arises on a polymer target after ion impact; (2) the chemistry of the top surface after ion impact; (3) the chemistry of sputtered films of polymeric material deposited on substrates placed adjacent to targets during ion impact; and (4) practical properties of textured polymer targets, specifically the wettability and adhesive bonding properties.

  15. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, Graeme (Inventor)

    1984-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids (16, 18) with multiple pairs of aligned holes positioned to direct a group of beamlets (20) along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam (14). An accelerator electrode device (22) downstream from the extraction grids, is at a much lower potential than the grids to accelerate the combined beam.

  16. Focused ion beam system

    DOEpatents

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  17. Focused ion beam system

    DOEpatents

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  18. Ion beam texturing

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    A microscopic surface texture is created by sputter etching a surface while simultaneously sputter depositing a lower sputter yield material onto the surface. A xenon ion beam source has been used to perform this texturing process on samples as large as three centimeters in diameter. Ion beam textured surface structures have been characterized with SEM photomicrographs for a large number of materials including Cu, Al, Si, Ti, Ni, Fe, Stainless steel, Au, and Ag. Surfaces have been textured using a variety of low sputter yield materials - Ta, Mo, Nb, and Ti. The initial stages of the texture creation have been documented, and the technique of ion beam sputter removal of any remaining deposited material has been studied. A number of other texturing parameters have been studied such as the variation of the texture with ion beam power, surface temperature, and the rate of texture growth with sputter etching time.

  19. Pulsed ion beam source

    DOEpatents

    Greenly, John B.

    1997-01-01

    An improved pulsed ion beam source having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center.

  20. Ion-beam technologies

    SciTech Connect

    Fenske, G.R.

    1993-01-01

    This compilation of figures and diagrams reviews processes for depositing diamond/diamond-like carbon films. Processes addressed are chemical vapor deposition (HFCVD, PACVD, etc.), plasma vapor deposition (plasma sputtering, ion beam sputtering, evaporation, etc.), low-energy ion implantation, and hybrid processes (biased sputtering, IBAD, biased HFCVD, etc.). The tribological performance of coatings produced by different means is discussed.

  1. Ion beam generating apparatus

    DOEpatents

    Brown, Ian G.; Galvin, James

    1987-01-01

    An ion generating apparatus utilizing a vacuum chamber, a cathode and an anode in the chamber. A source of electrical power produces an arc or discharge between the cathode and anode. The arc is sufficient to vaporize a portion of the cathode to form a plasma. The plasma is directed to an extractor which separates the electrons from the plasma, and accelerates the ions to produce an ion beam.

  2. Ion beam mixing by focused ion beam

    SciTech Connect

    Barna, Arpad; Kotis, Laszlo; Labar, Janos L.; Osvath, Zoltan; Toth, Attila L.; Menyhard, Miklos; Zalar, Anton; Panjan, Peter

    2007-09-01

    Si amorphous (41 nm)/Cr polycrystalline (46 nm) multilayer structure was irradiated by 30 keV Ga{sup +} ions with fluences in the range of 25-820 ions/nm{sup 2} using a focused ion beam. The effect of irradiation on the concentration distribution was studied by Auger electron spectroscopy depth profiling, cross-sectional transmission electron microscopy, and atomic force microscopy. The ion irradiation did not result in roughening on the free surface. On the other hand, the Ga{sup +} irradiation produced a strongly mixed region around the first Si/Cr interface. The thickness of mixed region depends on the Ga{sup +} fluence and it is joined to the pure Cr matrix with an unusual sharp interface. With increasing fluence the width of the mixed region increases but the interface between the mixed layer and pure Cr remains sharp. TRIDYN simulation failed to reproduce this behavior. Assuming that the Ga{sup +} irradiation induces asymmetric mixing, that is during the mixing process the Cr can enter the Si layer, but the Si cannot enter the Cr layer, the experimental findings can qualitatively be explained.

  3. Ion Beam Simulator

    Energy Science and Technology Software Center (ESTSC)

    2005-11-08

    IBSimu(Ion Beam Simulator) is a computer program for making two and three dimensional ion optical simulations. The program can solve electrostatic field in a rectangular mesh using Poisson equation using Finite Difference method (FDM). The mesh can consist of a coarse and a fine part so that the calculation accuracy can be increased in critical areas of the geometry, while most of the calculation is done quickly using the coarse mesh. IBSimu can launch ionmore » beam trajectories into the simulation from an injection surface or fomo plasma. Ion beam space charge of time independent simulations can be taken in account using Viasov iteration. Plasma is calculated by compensating space charge with electrons having Boltzmann energy distribution. The simulation software can also be used to calculate time dependent cases if the space charge is not calculated. Software includes diagnostic tools for plotting the geometry, electric field, space charge map, ion beam trajectories, emittance data and beam profiles.« less

  4. Ion Accelerator Merges Several Beams

    NASA Technical Reports Server (NTRS)

    Aston, G.

    1984-01-01

    Intense ion beam formed by merging multiple ion beamlets into one concentrated beam. Beamlet holes in graphite screen and focusing grids arranged in hexagonal pattern. Merged beam passes through single hole in each of aluminum accelerator and decelerator grids. Ion extraction efficiency, beam intensity, and focusing improved.

  5. Ion beam lithography system

    DOEpatents

    Leung, Ka-Ngo

    2005-08-02

    A maskless plasma-formed ion beam lithography tool provides for patterning of sub-50 nm features on large area flat or curved substrate surfaces. The system is very compact and does not require an accelerator column and electrostatic beam scanning components. The patterns are formed by switching beamlets on or off from a two electrode blanking system with the substrate being scanned mechanically in one dimension. This arrangement can provide a maskless nano-beam lithography tool for economic and high throughput processing.

  6. Nonpropulsive applications of ion beams

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    Eight centimeter ion beam sources utilizing xenon and argon have been developed that operate over a wide range of beam energies and currents. Three types of processes have been studied: sputter deposition, ion beam machining, and ion beam surface texturing. The broad range of source operating conditions allows optimum sputter deposition of various materials. An ion beam source was used to ion mill laser reflection holograms using photoresist patterns on silicon. Ion beam texturing was tried with many materials and has a multitude of potential applications.

  7. Pulsed ion beam source

    DOEpatents

    Greenly, J.B.

    1997-08-12

    An improved pulsed ion beam source is disclosed having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center. 12 figs.

  8. Transition of ion-acoustic perturbations in multicomponent plasma with negative ions

    SciTech Connect

    Sharma, Sumita Kumari; Devi, Kavita; Adhikary, Nirab Chandra; Bailung, Heremba

    2008-08-15

    Evolution of ion-acoustic compressive (positive) and rarefactive (negative) perturbations in a multicomponent plasma with negative ions has been investigated in a double plasma device. Transition of compressive solitons in electron-positive ion plasma, into a dispersing train of oscillations in a multicomponent plasma, when the negative ion concentration r exceeds a critical value r{sub c}, has been observed. On the other hand, an initial rarefactive perturbation initially evolves into a dispersing train of oscillations in electron-positive ion plasma and transforms into rarefactive solitons in a multicomponent plasma when the negative ion concentration is higher than the critical value. The Mach velocity and width of the compressive and rarefactive solitons are measured. The compressive solitons in the range 0r{sub c} have different characteristics than the Korteweg-de Vries (KdV) solitons at r=0 and modified KdV solitons at r=r{sub c}. A nonlinear differential equation having two terms to account for the lower and higher order nonlinearity has been used to explain the observed results.

  9. Metal Ion Sources for Ion Beam Implantation

    SciTech Connect

    Zhao, W. J.; Zhao, Z. Q.; Ren, X. T.

    2008-11-03

    In this paper a theme touched upon the progress of metal ion sources devoted to metal ion beam implantation (MIBI) will be reviewed. A special emphasis will be given to some kinds of ion sources such as ECR, MEVVA and Cluster ion sources. A novel dual hollow cathode metal ion source named DUHOCAMIS will be introduced and discussed.

  10. Ion beam sputter etching

    NASA Technical Reports Server (NTRS)

    Banks, Bruce A.; Rutledge, Sharon K.

    1986-01-01

    An ion beam etching process which forms extremely high aspect ratio surface microstructures using thin sputter masks is utilized in the fabrication of integrated circuits. A carbon rich sputter mask together with unmasked portions of a substrate is bombarded with inert gas ions while simultaneous carbon deposition occurs. The arrival of the carbon deposit is adjusted to enable the sputter mask to have a near zero or even slightly positive increase in thickness with time while the unmasked portions have a high net sputter etch rate.

  11. Introduction to Ion Beam Therapy

    SciTech Connect

    Martisikova, Maria

    2010-01-05

    Presently, ion beam therapy reaches an increasing interest within the field of radiation therapy, which is caused by the promising clinical results obtained in the last decades. Ion beams enable higher dose conformation to the tumor and increased sparing of the surrounding tissue in comparison to the standard therapy using high energy photons. Heavy ions, like carbon, offer in addition increased biological effectiveness, which makes them suitable for treatment of radioresistant tumors. This contribution gives an overview over the physical and biological properties of ion beams. Common fundamental principles of ion beam therapy are summarized and differences between standard therapy with high energy photons, proton and carbon ion therapy are discussed. The technologies used for the beam production and delivery are introduced, with emphasis to the differences between passive and active beam delivery systems. The last part concentrates on the quality assurance in ion therapy. Specialties of dosimetry in medical ion beams are discussed.

  12. Heavy ion beam probing

    SciTech Connect

    Hickok, R L

    1980-07-01

    This report consists of the notes distributed to the participants at the IEEE Mini-Course on Modern Plasma Diagnostics that was held in Madison, Wisconsin in May 1980. It presents an overview of Heavy Ion Beam Probing that briefly describes the principles and discuss the types of measurements that can be made. The problems associated with implementing beam probes are noted, possible variations are described, estimated costs of present day systems, and the scaling requirements for large plasma devices are presented. The final chapter illustrates typical results that have been obtained on a variety of plasma devices. No detailed calculations are included in the report, but a list of references that will provide more detailed information is included.

  13. Ion Beam Modification of Materials

    SciTech Connect

    Averback, B; de la Rubia, T D; Felter, T E; Hamza, A V; Rehn, L E

    2005-10-10

    This volume contains the proceedings of the 14th International Conference on Ion Beam Modification of Materials, IBMM 2004, and is published by Elsevier-Science Publishers as a special issue of Nuclear Instruments and Methods B. The conference series is the major international forum to present and discuss recent research results and future directions in the field of ion beam modification, synthesis and characterization of materials. The first conference in the series was held in Budapest, Hungary, 1978, and subsequent conferences were held every two years at locations around the Globe, most recently in Japan, Brazil, and the Netherlands. The series brings together physicists, materials scientists, and ion beam specialists from all over the world. The official conference language is English. IBMM 2004 was held on September 5-10, 2004. The focus was on materials science involving both basic ion-solid interaction processes and property changes occurring either during or subsequent to ion bombardment and ion beam processing in relation to materials and device applications. Areas of research included Nanostructures, Multiscale Modeling, Patterning of Surfaces, Focused Ion Beams, Defects in Semiconductors, Insulators and Metals, Cluster Beams, Radiation Effects in Materials, Photonic Devices, Ion Implantation, Ion Beams in Biology and Medicine including New Materials, Imaging, and Treatment.

  14. Observation of second order ion acoustic Peregrine breather in multicomponent plasma with negative ions

    NASA Astrophysics Data System (ADS)

    Pathak, Pallabi; Sharma, S. K.; Nakamura, Y.; Bailung, H.

    2016-02-01

    The experimental observation of second order ion acoustic Peregrine breathers in multicomponent plasma with negative ions is reported. A long wavelength initial perturbation on a continuous carrier frequency ˜0.5 ωpi (where ωpi is the ion plasma frequency) of finite amplitude is found to undergo self-modulation due to the interplay between nonlinear dispersive effect and group velocity dispersion because of modulational instability. Wave energy focusses to a smaller localized and isolated group of waves within the packet with amplitude amplification up to 5 times of the background carrier wave. The experimental results are compared with second order breather solution of nonlinear Schrodinger equation. The wavelet analysis and fast Fourier transform analysis of the experimental time series data indicate strong nonlinear evolution (wave energy focusing and spectral broadening) conforming to the formation of second order Peregrine solitons.

  15. Electron beam ion source and electron beam ion trap (invited)

    SciTech Connect

    Becker, Reinard; Kester, Oliver

    2010-02-15

    The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not ''sorcery'' but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.

  16. Ion beam sputtering of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Sovey, J. S.

    1978-01-01

    Etching and deposition of fluoropolymers are of considerable industrial interest for applications dealing with adhesion, chemical inertness, hydrophobicity, and dielectric properties. This paper describes ion beam sputter processing rates as well as pertinent characteristics of etched targets and films. An argon ion beam source was used to sputter etch and deposit the fluoropolymers PTFE, FEP, and CTFE. Ion beam energy, current density, and target temperature were varied to examine effects on etch and deposition rates. The ion etched fluoropolymers yield cone or spire-like surface structures which vary depending upon the type of polymer, ion beam power density, etch time, and target temperature. Also presented are sputter target and film characteristics which were documented by spectral transmittance measurements, X-ray diffraction, ESCA, and SEM photomicrographs.

  17. ION BEAM COLLIMATOR

    DOEpatents

    Langsdorf, A.S. Jr.

    1957-11-26

    A device is described for defining a beam of high energy particles wherein the means for defining the beam in the horizontal and vertical dimension are separately adjustable and the defining members are internally cooled. In general, the device comprises a mounting block having a central opening through which the beam is projected, means for rotatably supporting two pairs of beam- forming members, passages in each member for the flow of coolant; the beam- forming members being insulated from each other and the block, and each having an end projecting into the opening. The beam-forming members are adjustable and may be cooperatively positioned to define the beam passing between the end of the members. To assist in projecting and defining the beam, the member ends have individual means connected thereto for indicating the amount of charge collected thereon due to beam interception.

  18. Ion beam modification of metals

    NASA Astrophysics Data System (ADS)

    Dearnaley, G.

    1990-04-01

    Energetic ions beams may be used in various ways to modify and so improve the tribological properties of metals. These methods include: — ion implantation of selected additive species; — ion beam mixing of thin deposited coatings; — ion-beam-assisted deposition of thicker overlay coatings. The first of these techniques has been widely used to modify the electronic properties of semiconductors, but has since been extended for the treatment of all classes of material. Tool steels can be strengthened by the ion implantation of nitrogen or titanium, to produce fine dispersions of hard second-phase precipitates. Solid solution strengthening, by combinations of substitutional and interstitial species, such as yttrium and nitrogen, has also been successful. Both ion beam mixing (IBM) and ion-beam-assisted deposition (IBAD) use a combination of coating and ion bombardment. In the first case, the objective is to intermix the coating and substrate by the aid of radiation-enhanced diffusion. In the latter case, the coating is densified and modified during deposition and the process can be continued in order to build up overlay coatings several μm in thickness. The surface can then be tailored, for instance to provide a hard and adherent ceramic such as silicon nitride, boron nitride or titanium nitride. It is an advantage that all the above processes can be applied at relatively low temperatures, below about 200° C, thereby avoiding distortion of precision components. Ion implantation is also being successfully applied for the reduction of corrosion, especially at high temperatures or in the atmosphere and to explore the mechanisms of oxidation. Ion-assisted coatings, being compact and adherent, provide a more substantial protection against corrosion: silicon nitride and boron nitride are potentially useful in this respect. Examples will be given of the successful application of these methods for the surface modification of metals and alloys, and developments in the

  19. Applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Gelerinter, E.; Spielberg, N.

    1980-01-01

    Wire adhesion in steel belted radial tires; carbon fibers and composite; cold welding, brazing, and fabrication; hydrogen production, separation, and storage; membrane use; catalysis; sputtering and texture; and ion beam implantation are discussed.

  20. Cold atomic beam ion source for focused ion beam applications

    SciTech Connect

    Knuffman, B.; Steele, A. V.; McClelland, J. J.

    2013-07-28

    We report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1} and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1}. We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lower-brightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

  1. Neon Ion Beam Lithography (NIBL).

    PubMed

    Winston, Donald; Manfrinato, Vitor R; Nicaise, Samuel M; Cheong, Lin Lee; Duan, Huigao; Ferranti, David; Marshman, Jeff; McVey, Shawn; Stern, Lewis; Notte, John; Berggren, Karl K

    2011-10-12

    Existing techniques for electron- and ion-beam lithography, routinely employed for nanoscale device fabrication and mask/mold prototyping, do not simultaneously achieve efficient (low fluence) exposure and high resolution. We report lithography using neon ions with fluence <1 ion/nm(2), ∼1000× more efficient than using 30 keV electrons, and resolution down to 7 nm half-pitch. This combination of resolution and exposure efficiency is expected to impact a wide array of fields that are dependent on beam-based lithography. PMID:21899279

  2. Ion beam deposited protective films

    NASA Technical Reports Server (NTRS)

    Mirtich, M. J.

    1981-01-01

    Sputter deposition of adherent thin films on complex geometric surfaces by ion beam sources is examined in order to evaluate three different types of protective coatings for die materials. In the first experiment, a 30 cm diameter argon ion source was used to sputter deposit adherent metallic films up to eight microns thick on H-13 steel, and a thermal fatigue test specimen sputter deposited with metallic coatings one micron thick was immersed in liquid aluminum and cooled by water for 15,000 cycles to simulate operational environments. Results show that these materials do protect the steel by reducing thermal fatigue and thereby increasing die lifetime. The second experiment generated diamond-like carbon films using a dual beam ion source system that directed an eight cm argon ion source beam at the substrates. These films are still in the process of being evaluated for crystallinity, hardness and infrared absorption. The third experiment coated a fiber glass beam shield incorporated in the eight-cm diameter mercury ion thruster with molybdenum to ensure proper electrical and thermal properties. The coating maintained its integrity even under acceleration tests.

  3. Maskless, resistless ion beam lithography

    SciTech Connect

    Ji, Qing

    2003-03-10

    As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O{sub 2}{sup +}, BF{sub 2}{sup +}, P{sup +} etc., for surface modification and doping applications. With optimized source condition, around 85% of BF{sub 2}{sup +}, over 90% of O{sub 2}{sup +} and P{sup +} have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He{sup +} beam is as high as 440 A/cm{sup 2} {center_dot} Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O{sub 2}{sup +} ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O{sub 2}{sup +} ions with the dose of 10{sup 15} cm{sup -2}. The oxide can then serve as a hard mask for patterning of the Si film. The process flow and the experimental results for directly patterned poly-Si features

  4. Ion Beam Therapy in Europe

    NASA Astrophysics Data System (ADS)

    Kraft, Gerhard

    2009-03-01

    At present, seven facilities in Europe treat deep-seated tumors with particle beams, six with proton beams and one with carbon ions. Three of these facilities are in Moscow, St. Petersburg and Dubna, Russia. Other facilities include the TSL Uppsala, Sweden, CPO Orsay, France, and PSI Villigen, Switzerland, all for proton therapy, and GSI, Darmstadt, Germany, which utilizes carbon ions only. But only two of these facilities irradiate with scanned ion beams: the Paul Scherer Institute (PSI), Villigen (protons) and the Gesellschaft für Schwerionenforschung (GSI), Darmstadt. These two facilities are experimental units within physics laboratories and have developed the technique of intensity-modulated beam scanning in order to produce irradiation conforming to a 3-D target. There are three proton centers presently under construction in Munich, Essen and Orsay, and the proton facility at PSI has added a superconducting accelerator connected to an isocentric gantry in order to become independent of the accelerator shared with the physics research program. The excellent clinical results using carbon ions at National Institute of Radiological Science (NIRS) in Chiba and GSI have triggered the construction of four new heavy-ion therapy projects (carbon ions and protons), located in Heidelberg, Pavia, Marburg and Kiel. The projects in Heidelberg and Pavia will begin patient treatment in 2009, and the Marburg and Kiel projects will begin in 2010 and 2011, respectively. These centers use different accelerator designs but have the same kind of treatment planning system and use the same approach for the calculation of the biological effectiveness of the carbon ions as developed at GSI [1]. There are many other planned projects in the works. Do not replace the word "abstract," but do replace the rest of this text. If you must insert a hard line break, please use Shift+Enter rather than just tapping your "Enter" key. You may want to print this page and refer to it as a style

  5. Ion-beam-driven electrostatic ion cyclotron instabilities

    SciTech Connect

    Miura, A.; Okuda, H.; Ashour-Abdalla, M.

    1982-10-01

    We present results of numerical simulations on the electrostatic ion cyclotron instabilities driven by the ion beam parallel to the magnetic field. For the beam speed exceeding the thermal speed of background ions and the beam temperature much lower than the background ion temperature, it is found that the instability results in strong perpendicular heating and slowing down of parallel drift of the beam ions, leading to the saturation of the instability. Applications to plasma heating and space plasma physics are discussed.

  6. Focused ion beams in biology.

    PubMed

    Narayan, Kedar; Subramaniam, Sriram

    2015-11-01

    A quiet revolution is under way in technologies used for nanoscale cellular imaging. Focused ion beams, previously restricted to the materials sciences and semiconductor fields, are rapidly becoming powerful tools for ultrastructural imaging of biological samples. Cell and tissue architecture, as preserved in plastic-embedded resin or in plunge-frozen form, can be investigated in three dimensions by scanning electron microscopy imaging of freshly created surfaces that result from the progressive removal of material using a focused ion beam. The focused ion beam can also be used as a sculpting tool to create specific specimen shapes such as lamellae or needles that can be analyzed further by transmission electron microscopy or by methods that probe chemical composition. Here we provide an in-depth primer to the application of focused ion beams in biology, including a guide to the practical aspects of using the technology, as well as selected examples of its contribution to the generation of new insights into subcellular architecture and mechanisms underlying host-pathogen interactions. PMID:26513553

  7. Arbitrary amplitude ion-acoustic waves in a multicomponent plasma with superthermal species

    SciTech Connect

    El-Tantawy, S. A.; Moslem, W. M.

    2011-11-15

    Properties of fully nonlinear ion-acoustic waves in a multicomponent plasma consisting of warm positive ions, superthermal electrons, as well as positrons, and dust impurities have been investigated. By using the hydrodynamic model for ions and superthermal electron/positron distribution, a Sagdeev potential has been derived. Existence conditions for large amplitude solitary and shock waves are presented. In order to show that the characteristics of the solitary and shock waves are influenced by the plasma parameters, the relevant numerical analysis of the Sagdeev potential is presented. The nonlinear structures, as predicted here, may be associated with the electrostatic perturbations in interstellar medium.

  8. 2-D Gaussian beam imaging of multicomponent seismic data in anisotropic media

    NASA Astrophysics Data System (ADS)

    Protasov, M. I.

    2015-12-01

    An approach for true-amplitude seismic beam imaging of multicomponent seismic data in 2-D anisotropic elastic media is presented and discussed. Here, the recovered true-amplitude function is a scattering potential. This approach is a migration procedure based on the weighted summation of pre-stack data. The true-amplitude weights are computed by applying Gaussian beams (GBs). We shoot a pair of properly chosen GBs with a fixed dip and opening angles from the current imaging point towards an acquisition system. This pair of beams is used to compute a true-amplitude selective image of a rapid velocity variation. The total true-amplitude image is constructed by superimposing selective images computed for a range of available dip angles. The global regularity of the GBs allows one to disregard whether a ray field is regular or irregular. P- and S-wave GBs can be used to handle raw multicomponent data without separating the waves. The use of anisotropic GBs allows one to take into account the anisotropy of the background model.

  9. Linear analysis of ion cyclotron interaction in a multicomponent plasma

    NASA Technical Reports Server (NTRS)

    Gendrin, R.; Ashour-Abdalla, M.; Omura, Y.; Quest, K.

    1984-01-01

    The mechanism by which hot anisotropic protons generate electromagnetic ion cyclotron waves in a plasma containing cold H(+) and He(+) ions is quantitatively studied. Linear growth rates (both temporal and spatial) are computed for different plasma parameters: concentration, temperature,and anisotropy of cold He(+) ions and of hot protons. It is shown that: (1) for parameters typical of the geostationary altitude the maximum growth rates are not drastically changed when a small proportion (about 1 to 20 percent) of cold He(+) ions is present; (2) because of the important cyclotron absorption by thermal He(+) ions in the vicinity of the He(+) gyrofrequency, waves which could resonate with the bulk of the He(+) distribution cannot be generated. Therefore quasi-linear effects, in a homogeneous medium at least, cannot be responsible for the heating of He(+) ions which is often observed in conjunction with ion cyclotron waves. The variation of growth rate versus wave number is also studied for its importance in selecting suitable parameters in numerical simulation experiments.

  10. Bifurcations of nonlinear ion-acoustic travelling waves in a multicomponent magnetoplasma with superthermal electrons

    NASA Astrophysics Data System (ADS)

    Selim, M. M.; El-Depsy, A.; El-Shamy, E. F.

    2015-12-01

    Properties of nonlinear ion-acoustic travelling waves propagating in a three-dimensional multicomponent magnetoplasma system composed of positive ions, negative ions and superthermal electrons are considered. Using the reductive perturbation technique (RPT), the Zkharov-Kuznetsov (ZK) equation is derived. The bifurcation theory of planar dynamical systems is applied to investigate the existence of the solitary wave solutions and the periodic travelling wave solutions of the resulting ZK equation. It is found that both compressive and rarefactive nonlinear ion-acoustic travelling waves strongly depend on the external magnetic field, the unperturbed positive-to-negative ions density ratio, the direction cosine of the wave propagation vector with the Cartesian coordinates, as well as the superthermal electron parameter. The present model may be useful for describing the formation of nonlinear ion-acoustic travelling wave in certain astrophysical scenarios, such as the D and F-regions of the Earth's ionosphere.

  11. Integration of scanning probes and ion beams

    SciTech Connect

    Persaud, A.; Park, S.J.; Liddle, J.A.; Schenkel, T.; Bokor, J.; Rangelow, I.

    2005-03-30

    We report the integration of a scanning force microscope with ion beams. The scanning probe images surface structures non-invasively and aligns the ion beam to regions of interest. The ion beam is transported through a hole in the scanning probe tip. Piezoresistive force sensors allow placement of micromachined cantilevers close to the ion beam lens. Scanning probe imaging and alignment is demonstrated in a vacuum chamber coupled to the ion beam line. Dot arrays are formed by ion implantation in resist layers on silicon samples with dot diameters limited by the hole size in the probe tips of a few hundred nm.

  12. Ion-beam Plasma Neutralization Interaction Images

    SciTech Connect

    Igor D. Kaganovich; Edward Startsev; S. Klasky; Ronald C. Davidson

    2002-04-09

    Neutralization of the ion beam charge and current is an important scientific issue for many practical applications. The process of ion beam charge and current neutralization is complex because the excitation of nonlinear plasma waves may occur. Computer simulation images of plasma neutralization of the ion beam pulse are presented.

  13. ION BEAM FOCUSING MEANS FOR CALUTRON

    DOEpatents

    Backus, J.G.

    1959-06-01

    An ion beam focusing arrangement for calutrons is described. It provides a virtual focus of origin for the ion beam so that the ions may be withdrawn from an arc plasma of considerable width providing greater beam current and accuracy. (T.R.H.)

  14. Ion beam microtexturing of surfaces

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1981-01-01

    Some recent work in surface microtecturing by ion beam sputtering is described. The texturing is accomplished by deposition of an impurity onto a substrate while simultaneously bombarding it with an ion beam. A summary of the theory regarding surface diffusion of impurities and the initiation of cone formation is provided. A detailed experimental study of the time-development of individual sputter cones is described. A quasi-liquid coating was observed that apparently reduces the sputter rate of the body of a cone compared to the bulk material. Experimental measurements of surface diffusion activation energies are presented for a variety of substrate-seed combinations and range from about 0.3 eV to 1.2 eV. Observations of apparent crystal structure in sputter cones are discussed. Measurements of the critical temperature for cone formation are also given along with a correlation of critical temperature with substrate sputter rate.

  15. Obliquely incident ion beam figuring

    NASA Astrophysics Data System (ADS)

    Zhou, Lin; Dai, Yifan; Xie, Xuhui; Li, Shengyi

    2015-10-01

    A new ion beam figuring (IBF) technique, obliquely incident IBF (OI-IBF), is proposed. In OI-IBF, the ion beam bombards the optical surface obliquely with an invariable incident angle instead of perpendicularly as in the normal IBF. Due to the higher removal rate in oblique incidence, the process time in OI-IBF can be significantly shortened. The removal rates at different incident angles were first tested, and then a test mirror was processed by OI-IBF. Comparison shows that in the OI-IBF technique with a 30 deg incident angle, the process time was reduced by 56.8%, while keeping the same figure correcting ability. The experimental results indicate that the OI-IBF technique is feasible and effective to improve the surface correction process efficiency.

  16. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y.S.

    1991-08-20

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used. 5 figures.

  17. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y. Simon

    1991-01-01

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used.

  18. Ion beam inertial confinement target

    DOEpatents

    Bangerter, Roger O.; Meeker, Donald J.

    1985-01-01

    A target for implosion by ion beams composed of a spherical shell of frozen DT surrounded by a low-density, low-Z pusher shell seeded with high-Z material, and a high-density tamper shell. The target has various applications in the inertial confinement technology. For certain applications, if desired, a low-density absorber shell may be positioned intermediate the pusher and tamper shells.

  19. Neurosurgical applications of ion beams

    NASA Astrophysics Data System (ADS)

    Fabrikant, Jacob I.; Levy, Richard P.; Phillips, Mark H.; Frankel, Kenneth A.; Lyman, John T.

    1989-04-01

    The program at Donner Pavilion has applied nuclear medicine research to the diagnosis and radiosurgical treatment of life-threatening intracranial vascular disorders that affect more than half a million Americans. Stereotactic heavy-charged-particle Bragg peak radiosurgery, using narrow beams of heavy ions, demonstrates superior biological and physical characteristics in brain over X-and γ-rays, viz., improved dose distribution in the Bragg peak and sharp lateral and distal borders and less scattering of the beam. Examination of CNS tissue response and alteration of cerebral blood-flow dynamics related to heavy-ion Bragg peak radiosurgery is carried out using three-dimensional treatment planning and quantitative imaging utilizing cerebral angiography, computerized tomography (CT), magnetic resonance imaging (MRI), cine-CT, xenon X-ray CT and positron emission tomography (PET). Also under examination are the physical properties of narrow heavy-ion beams for improving methods of dose delivery and dose distribution and for establishing clinical RBE/LET and dose-response relationships for human CNS tissues. Based on the evaluation and treatment with stereotactically directed narrow beams of heavy charged particles of over 300 patients, with cerebral angiography, CT scanning and MRI and PET scanning of selected patients, plus extensive clinical and neuroradiological followup, it appears that Stereotactic charged-particle Bragg peak radiosurgery obliterates intracranial arteriovenous malformations or protects against rebleeding with reduced morbidity and no mortality. Discussion will include the method of evaluation, the clinical research protocol, the Stereotactic neuroradiological preparation, treatment planning, the radiosurgery procedure and the protocol for followup. Emphasis will be placed on the neurological results, including the neuroradiological and clinical response and early and late delayed injury in brain leading to complications (including vasogenic edema

  20. Lower Hybrid Oscillations in Multicomponent Space Plasmas Subjected to Ion Cyclotron Waves

    NASA Technical Reports Server (NTRS)

    Khazanov, G. V.; Krivorutsky, E. N.; Moore, T. E.; Liemohn, M. W.; Horwitz, J. L.

    1997-01-01

    It is found that in multicomponent plasmas subjected to Alfven or fast magnetosonic waves, such as are observed in regions of the outer plasmasphere and ring current-plasmapause overlap, lower hybrid oscillations are generated. The addition of a minor heavy ion component to a proton-electron plasma significantly lowers the low-frequency electric wave amplitude needed for lower hybrid wave excitation. It is found that the lower hybrid wave energy density level is determined by the nonlinear process of induced scattering by ions and electrons; hydrogen ions in the region of resonant velocities are accelerated; and nonresonant particles are weakly heated due to the induced scattering. For a given example, the light resonant ions have an energy gain factor of 20, leading to the development of a high-energy tail in the H(+) distribution function due to low-frequency waves.

  1. Focused electron and ion beam systems

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  2. Charge state, angular distribution, and kinetic energy of ions from multicomponent-cathodes in vacuum arc devices

    SciTech Connect

    Nikolaev, A. G. Savkin, K. P.; Yushkov, G. Yu.; Frolova, V. P.; Barengolts, S. A.

    2014-12-07

    We present research results on vacuum arc plasma produced with multicomponent cathode made of several different elements. The ion mass-to-charge-state spectra of the plasmas were studied by time-of-flight spectrometry. The angular distributions of different ion species were measured, and the kinetic energy of their directed (streaming) motion was determined. It is shown that the fractional composition of ions of different cathode components in the plasma flow from the cathode spot closely matches the fractional content of these components in the composite cathode. The charge states of ions of the various cathode components are determined by the average electron temperature in the cathode spot plasma. The angular distribution of lower mass ions in the plasma from a multicomponent cathode is less isotropic and broader than for the plasma from a single-component cathode of the same light element. The directed kinetic energies of the ions of the different components for plasma from a multicomponent cathode are lower for lighter elements and greater for heavier elements compared to the ion directed energy for plasmas from single-component cathodes made of the same materials. The physical processes responsible for these changes in the ion charge states in multicomponent-cathode vacuum arc plasma are discussed.

  3. Pseudo ribbon metal ion beam source

    SciTech Connect

    Stepanov, Igor B. Ryabchikov, Alexander I.; Sivin, Denis O.; Verigin, Dan A.

    2014-02-15

    The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface.

  4. The electromagnetic ion cyclotron beam anisotropy instability

    NASA Technical Reports Server (NTRS)

    Peter Gary, S.; Schriver, David

    1987-01-01

    Electromagnetic instabilities driven by an anisotropic, relatively cool ion beam are studied for the case in which both the beam and the instabilities propagate parallel or antiparallel to a uniform magnetic field. At modest beam-core relative drift speeds, sufficiently large perpendicular-to-parallel beam temperature ratios and sufficiently large plasma beta, the mode of fastest growth rate is the ion cyclotron beam anisotropy instability. Because the right-hand polarized waves observed upstream of slow shocks in the earth's magnetotail can lead to the appropriate beam anisotropy, the ion cyclotron instability may be present and account for the left-hand polarized magnetic waves observed there. Also, because of its relatively low phase speed, the ion cyclotron beam anisotropy instability may provide the scattering necessary for ion Fermi acceleration at slow shocks of sufficiently high plasma beta.

  5. Negative Ion Beam Extraction and Emittance

    SciTech Connect

    Holmes, Andrew J. T.

    2007-08-10

    The use of magnetic fields to both aid the production of negative ions and suppress the co-extracted electrons causes the emittance and hence the divergence of the negative ion beam to increase significantly due to the plasma non-uniformity from jxB drift. This drift distorts the beam-plasma meniscus and experimental results of the beam emittance are presented, which show that non-uniformity causes the square of the emittance to be proportional to the 2/3 power of the extracted current density. This can cause the divergence of the negative ion beam to be significantly larger than its positive ion counterpart. By comparing results from positive and negative ion beam emittances from the same source, it is also possible to draw conclusions about their vulnerability to magnetic effects. Finally emittances of caesiated and un-caesiated negative ion beams are compared to show how the surface and volume modes of production interact.

  6. Molecular Ion Beam Transportation for Low Energy Ion Implantation

    SciTech Connect

    Kulevoy, T. V.; Kropachev, G. N.; Seleznev, D. N.; Yakushin, P. E.; Kuibeda, R. P.; Kozlov, A. V.; Koshelev, V. A.; Hershcovitch, A.; Johnson, B. M.; Gushenets, V. I.; Oks, E. M.; Polozov, S. M.; Poole, H. J.

    2011-01-07

    A joint research and development of steady state intense boron ion sources for 100's of electron-volt ion implanters has been in progress for the past five years. Current density limitation associated with extracting and transporting low energy ion beams result in lower beam currents that in turn adversely affects the process throughput. The transport channel with electrostatic lenses for decaborane (B{sub 10}H{sub 14}) and carborane (C{sub 2}B{sub 10}H{sub 12}) ion beams transportation was developed and investigated. The significant increase of ion beam intensity at the beam transport channel output is demonstrated. The transport channel simulation, construction and experimental results of ion beam transportation are presented.

  7. Plasma formed ion beam projection lithography system

    SciTech Connect

    Leung, Ka-Ngo; Lee, Yung-Hee Yvette; Ngo, Vinh; Zahir, Nastaran

    2002-01-01

    A plasma-formed ion-beam projection lithography (IPL) system eliminates the acceleration stage between the ion source and stencil mask of a conventional IPL system. Instead a much thicker mask is used as a beam forming or extraction electrode, positioned next to the plasma in the ion source. Thus the entire beam forming electrode or mask is illuminated uniformly with the source plasma. The extracted beam passes through an acceleration and reduction stage onto the resist coated wafer. Low energy ions, about 30 eV, pass through the mask, minimizing heating, scattering, and sputtering.

  8. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Wang, Joseph

    2010-05-21

    Ion beam emission/neutralization is one of the most fundamental problems in spacecraft plasma interactions and electric propulsion. Although ion beam neutralization is readily achieved in experiments, the understanding of the underlying physical process remains at a rather primitive level. No theoretical or simulation models have convincingly explained the detailed neutralization mechanism, and no conclusions have been reached. This paper presents a fully kinetic simulation of ion beam neutralization and plasma beam propagation and discusses the physics of electron-ion coupling and the resulting propagation of a neutralized mesothermal plasma.

  9. Neutral Beam Ion Confinement in NSTX

    SciTech Connect

    D.S. Darrow; E.D. Fredrickson; S.M. Kaye; S.S. Medley; and A.L. Roquemore

    2001-07-24

    Neutral-beam (NB) heating in the National Spherical Torus Experiment (NSTX) began in September 2000 using up to 5 MW of 80 keV deuterium (D) beams. An initial assessment of beam ion confinement has been made using neutron detectors, a neutral particle analyzer (NPA), and a Faraday cup beam ion loss probe. Preliminary neutron results indicate that confinement may be roughly classical in quiescent discharges, but the probe measurements do not match a classical loss model. MHD activity, especially reconnection events (REs) causes substantial disturbance of the beam ion population.

  10. The Electron Beam Ion Source (EBIS)

    ScienceCinema

    Brookhaven Lab

    2010-01-08

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  11. The Electron Beam Ion Source (EBIS)

    SciTech Connect

    Brookhaven Lab

    2009-06-09

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  12. Low energy ion beam dynamics of NANOGAN ECR ion source

    NASA Astrophysics Data System (ADS)

    Kumar, Sarvesh; Mandal, A.

    2016-04-01

    A new low energy ion beam facility (LEIBF) has been developed for providing the mass analyzed highly charged intense ion beams of energy ranging from a few tens of keV to a few MeV for atomic, molecular and materials sciences research. The new facility consists of an all permanent magnet 10 GHz electron cyclotron resonance (ECR) ion source (NANOGAN) installed on a high voltage platform (400 kV) which provides large currents of multiply charged ion beams. Higher emittance at low energy of intense ion beam puts a tremendous challenge to the beam optical design of this facility. The beam line consists of mainly the electrostatic quadrupoles, an accelerating section, analyzing cum switching magnet and suitable beam diagnostics including vacuum components. The accelerated ion beam is analyzed for a particular mass to charge (m/q) ratio as well as guided to three different lines along 75°, 90° and 105° using a large acceptance analyzing cum switching magnet. The details of transverse beam optics to all the beam lines with TRANSPORT and GICOSY beam optics codes are being described. Field computation code, OPERA 3D has been utilized to design the magnets and electrostatic quadrupoles. A theoretical estimation of emittance for optimized geometry of ion source is given so as to form the basis of beam optics calculations. The method of quadrupole scan of the beam is used to characterize the emittance of the final beam on the target. The measured beam emittance increases with m/q ratios of various ion beams similar to the trend observed theoretically.

  13. Calculation of multicomponent ionic diffusion from zero to high concentration: II. Inclusion of associated ion species

    NASA Astrophysics Data System (ADS)

    Felmy, Andrew R.; Weare, John H.

    1991-01-01

    This paper presents a theoretical model of multicomponent ionic diffusion which is valid to high concentration for systems which show ion association. The development is completely general for species which do not react with the solvent. It is demonstrated that the Onsager phenomenological coefficients for associated ion species can be unambiguously determined only in solutions where the concentration of these species can be independently measured. In all other instances, only combinations of the Onsager coefficients for the bare ions and the ion pairs can be experimentally determined. The results of our formulations are contrasted with those of more simplified models for systems containing Na 2SO 4 and MgSO 4, as well as for multicomponent natural seawater. The differences between our model and simplified models are significant, especially at high concentration. Inconsistencies which may develop with the use of the simplified approaches are demonstrated. Our approach requires considerable data which are not available at temperatures other than 25°C. Therefore, other approaches which are based only on data at infinite dilution are of great interest. We show here that, if chemical potential derivatives are included in the infinite dilution model of Nernst and Hartley which uses only infinite dilution mobilities, the model can be extended to slightly concentrated solutions. This extended Nernst-Hartley model gives good agreement with all of the existing experimental mutual diffusion coefficient data at concentrations below about 0.2 M in the six component system Na-K-Ca-Mg-Cl-SO 4-H 2O. This may be the most reliable way to extend infinite dilution data into more concentrated regions. In the systems we have studied, the inclusion of ion-association species for weakly interacting species does not appear to provide significant improvement over our generalized Nernst-Hartley model.

  14. Treatment Planning for Ion Beam Therapy

    NASA Astrophysics Data System (ADS)

    Greilich, Steffen; Jäkel, Oliver

    2010-01-01

    Beams of charged particles offer an improved dose conformation to the target volume as compared to photon radiotherapy, with better sparing of normal tissue structures close to the target. In addition, beams of ions heavier than helium exhibit a strong increase of the Linear Energy Transfer (LET) in the Bragg peak as compared to the entrance region, resulting in a higher biological efficiency in the target region. These physical and biological properties make ion beams more favorable for radiation therapy of cancer than photon beams. As a consequence, particle therapy with heavy ions has gained increasing interest worldwide. To fully benefit from the advantages of ion radiotherapy, appropriate treatment planning has to be done—taking into account the specific characteristics of ion beams, e.g. the inverted depth-dose profile, nuclear fragmentation, and increase radiobiological effectiveness. This paper describes in brief the approach taken at GSI Darmstadt and HIT Heidelberg for an active 3D beam scanning system.

  15. Correlation between surface chemistry and ion energy dependence of the etch yield in multicomponent oxides etching

    SciTech Connect

    Berube, P.-M.; Poirier, J.-S.; Margot, J.; Stafford, L.; Ndione, P. F.; Chaker, M.; Morandotti, R.

    2009-09-15

    The influence of surface chemistry in plasma etching of multicomponent oxides was investigated through measurements of the ion energy dependence of the etch yield. Using pulsed-laser-deposited Ca{sub x}Ba{sub (1-x)}Nb{sub 2}O{sub 6} (CBN) and SrTiO{sub 3} thin films as examples, it was found that the etching energy threshold shifts toward values larger or smaller than the sputtering threshold depending on whether or not ion-assisted chemical etching is the dominant etching pathway and whether surface chemistry is enhancing or inhibiting desorption of the film atoms. In the case of CBN films etched in an inductively coupled Cl{sub 2} plasma, it is found that the chlorine uptake is inhibiting the etching reaction, with the desorption of nonvolatile NbCl{sub 2} and BaCl{sub 2} compounds being the rate-limiting step.

  16. Laser cooling of a stored ion beam: A first step towards crystalline beams

    SciTech Connect

    Hangst, J.S.

    1992-09-01

    This report discusses: a brief introduction to storage rings; crystalline beams; laser cooling of ion beams; description of astrid-the experimental setup; first experiments with lithium 7 ion beam; experiments with erbium 166 ion beams; further experiments with lithium 7 ion beams; beam dynamics, laser cooling,and crystalline beams in astrid; possibilities for further study in astrid.

  17. Ion optics of RHIC electron beam ion source

    SciTech Connect

    Pikin, A.; Alessi, J.; Beebe, E.; Kponou, A.; Okamura, M.; Raparia, D.; Ritter, J.; Tan, Y.; Kuznetsov, G.

    2012-02-15

    RHIC electron beam ion source has been commissioned to operate as a versatile ion source on RHIC injection facility supplying ion species from He to Au for Booster. Except for light gaseous elements RHIC EBIS employs ion injection from several external primary ion sources. With electrostatic optics fast switching from one ion species to another can be done on a pulse to pulse mode. The design of an ion optical structure and the results of simulations for different ion species are presented. In the choice of optical elements special attention was paid to spherical aberrations for high-current space charge dominated ion beams. The combination of a gridded lens and a magnet lens in LEBT provides flexibility of optical control for a wide range of ion species to satisfy acceptance parameters of RFQ. The results of ion transmission measurements are presented.

  18. TOPICAL REVIEW Dosimetry for ion beam radiotherapy

    NASA Astrophysics Data System (ADS)

    Karger, Christian P.; Jäkel, Oliver; Palmans, Hugo; Kanai, Tatsuaki

    2010-11-01

    Recently, ion beam radiotherapy (including protons as well as heavier ions) gained considerable interest. Although ion beam radiotherapy requires dose prescription in terms of iso-effective dose (referring to an iso-effective photon dose), absorbed dose is still required as an operative quantity to control beam delivery, to characterize the beam dosimetrically and to verify dose delivery. This paper reviews current methods and standards to determine absorbed dose to water in ion beam radiotherapy, including (i) the detectors used to measure absorbed dose, (ii) dosimetry under reference conditions and (iii) dosimetry under non-reference conditions. Due to the LET dependence of the response of films and solid-state detectors, dosimetric measurements are mostly based on ion chambers. While a primary standard for ion beam radiotherapy still remains to be established, ion chamber dosimetry under reference conditions is based on similar protocols as for photons and electrons although the involved uncertainty is larger than for photon beams. For non-reference conditions, dose measurements in tissue-equivalent materials may also be necessary. Regarding the atomic numbers of the composites of tissue-equivalent phantoms, special requirements have to be fulfilled for ion beams. Methods for calibrating the beam monitor depend on whether passive or active beam delivery techniques are used. QA measurements are comparable to conventional radiotherapy; however, dose verification is usually single field rather than treatment plan based. Dose verification for active beam delivery techniques requires the use of multi-channel dosimetry systems to check the compliance of measured and calculated dose for a representative sample of measurement points. Although methods for ion beam dosimetry have been established, there is still room for developments. This includes improvement of the dosimetric accuracy as well as development of more efficient measurement techniques.

  19. Heavy ion beams for inertial fusion

    SciTech Connect

    Godlove, T.F.; Herrmannsfeldt, W.B.

    1980-05-01

    The United States' program in inertial confinement fusion (ICF) is described in this paper, with emphasis on the studies of the use of intense high energy beams of heavy ions to provide the power and energy needed to initiate thermonuclear burn. Preliminary calculations of the transport of intense ion beams in an electrostatic quadrupole focussing structure are discussed.

  20. Optical Faraday Cup for Heavy Ion Beams

    SciTech Connect

    Bieniosek, Frank; Bieniosek, F.M.; Eylon, S.; Roy, P.K.; Yu, S.S.

    2007-06-25

    We have been using alumina scintillators for imaging beams in heavy-ion beam fusion experiments in 2 to 4 transverse dimensions [1]. The scintillator has a limited lifetime under bombardment by the heavy ion beams. As a possible replacement for the scintillator, we are studying the technique of imaging the beam on a gas cloud. A gas cloud for imaging the beam may be created on a solid hole plate placed in the path of the beam, or by a localized gas jet. It is possible to image the beam using certain fast-quenching optical lines that closely follow beam current density and are independent of gas density. We describe this technique and show preliminary experimental data. This approach has promise to be a new fast beam current diagnostic on a nanosecond time scale.

  1. Focused ion beam source method and apparatus

    DOEpatents

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  2. Focused Ion Beam Technology for Optoelectronic Devices

    NASA Astrophysics Data System (ADS)

    Reithmaier, J. P.; Bach, L.; Forchel, A.

    2003-08-01

    High-resolution proximity free lithography was developed using InP as anorganic resist for ion beam exposure. InP is very sensitive on ion beam irradiation and show a highly nonlinear dose dependence with a contrast function comparable to organic electron beam resists. In combination with implantation induced quantum well intermixing this new lithographic technique based on focused ion beams is used to realize high performance nano patterned optoelectronic devices like complex coupled distributed feedback (DFB) and distributed Bragg reflector (DBR) lasers.

  3. Ion beam sputtering in electric propulsion facilities

    NASA Technical Reports Server (NTRS)

    Sovey, James S.; Patterson, Michael J.

    1991-01-01

    Experiments were undertaken to determine sputter yields of potential ion beam target materials, to assess the impact of charge exchange on beam diagnostics in large facilities, and to examine material erosion and deposition after a 957 hr test of a 5 kW-class ion thruster. The xenon ion sputter yield of flexible graphite was lower than other graphite forms especially at high angles of incidence. Ion beam charge exchange effects were found to hamper beam probe current collection diagnostics even at pressures from 0.7 to 1.7 mPa. Estimates of the xenon ion beam envelope were made and predictions of the thickness of sputter deposited coatings in the facility were compared with measurements.

  4. Ion beam sputtering in electric propulsion facilities

    NASA Technical Reports Server (NTRS)

    Sovey, James S.; Patterson, Michael J.

    1991-01-01

    Experiments were undertaken to determine sputter yields of potential ion beam target materials, to assess the impact of charge exchange on beam diagnostics in large facilities, and to examine material erosion and deposition after a 957-hour test of a 5 kW-class ion thruster. The xenon ion sputter yield of flexible graphite was lower than other graphite forms especialy at high angles of incidence. Ion beam charge exchange effects were found to hamper beam probe current collection diagnostics even at pressures from 0.7 to 1.7 mPa. Estimates of the xenon ion beam envelope were made and predictions of the thickness of sputter deposited coatings in the facility were compared with measurements.

  5. Ion beam microtexturing and enhanced surface diffusion

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1982-01-01

    Ion beam interactions with solid surfaces are discussed with particular emphasis on microtexturing induced by the deliberate deposition of controllable amounts of an impurity material onto a solid surface while simultaneously sputtering the surface with an ion beam. Experimental study of the optical properties of microtextured surfaces is described. Measurements of both absorptance as a function of wavelength and emissivity are presented. A computer code is described that models the sputtering and ion reflection processes involved in microtexture formation.

  6. Beam-beam observations in the Relativistic Heavy Ion Collider

    SciTech Connect

    Luo, Y.; Fischer, W.; White, S.

    2015-06-24

    The Relativistic Heavy Ion Collider (RHIC) at Brookhaven National Laboratory has been operating since 2000. Over the past decade, thanks to the continuously increased bunch intensity and reduced β*s at the interaction points, the maximum peak luminosity in the polarized proton operation has been increased by more than two orders of magnitude. In this article, we first present the beam-beam observations in the previous RHIC polarized proton runs. Then we analyze the mechanisms for the beam loss and emittance growth in the presence of beam-beam interaction. The operational challenges and limitations imposed by beam-beam interaction and their remedies are also presented. In the end, we briefly introduce head-on beam-beam compensation with electron lenses in RHIC.

  7. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, Joshua (Inventor); Hubbell, Theodore E. (Inventor)

    1987-01-01

    A surface of a steel substrate is nitrided without external heating by exposing it to a beam of nitrogen ions under low pressure, a pressure much lower than that employed for ion-nitriding. An ion source is used instead of a glow discharge. Both of these features reduce the introduction of impurities into the substrate surface.

  8. Simulation of ion beam transport through the 400 Kv ion implanter at Michigan Ion Beam Laboratory

    SciTech Connect

    Naab, F. U.; Toader, O. F.; Was, G. S.

    2013-04-19

    The Michigan Ion Beam Laboratory houses a 400 kV ion implanter. An application that simulates the ion beam trajectories through the implanter from the ion source to the target was developed using the SIMION Registered-Sign code. The goals were to have a tool to develop an intuitive understanding of abstract physics phenomena and diagnose ion trajectories. Using this application, new implanter users of different fields in science quickly understand how the machine works and quickly learn to operate it. In this article we describe the implanter simulation application and compare the parameters of the implanter components obtained from the simulations with the measured ones. The overall agreement between the simulated and measured values of magnetic fields and electric potentials is {approx}10%.

  9. Intense non-relativistic cesium ion beam

    SciTech Connect

    Lampel, M.C.

    1984-02-01

    The Heavy Ion Fusion group at Lawrence Berkeley Laboratory has constructed the One Ampere Cesium Injector as a proof of principle source to supply an induction linac with a high charge density and high brightness ion beam. This is studied here. An electron beam probe was developed as the major diagnostic tool for characterizing ion beam space charge. Electron beam probe data inversion is accomplished with the EBEAM code and a parametrically adjusted model radial charge distribution. The longitudinal charge distribution was not derived, although it is possible to do so. The radial charge distribution that is derived reveals an unexpected halo of trapped electrons surrounding the ion beam. A charge fluid theory of the effect of finite electron temperature on the focusing of neutralized ion beams (Nucl. Fus. 21, 529 (1981)) is applied to the problem of the Cesium beam final focus at the end of the injector. It is shown that the theory's predictions and assumptions are consistent with the experimental data, and that it accounts for the observed ion beam radius of approx. 5 cm, and the electron halo, including the determination of an electron Debye length of approx. 10 cm.

  10. Laser ion source for low charge heavy ion beams

    SciTech Connect

    Okamura,M.; Pikin, A.; Zajic, V.; Kanesue, T.; Tamura, J.

    2008-08-03

    For heavy ion inertial fusion application, a combination of a laser ion source and direct plasma injection scheme into an RFQ is proposed. The combination might provide more than 100 mA of singly charged heavy ion beam from a single laser shot. A planned feasibility test with moderate current is also discussed.

  11. Modified betatron for ion beam fusion

    SciTech Connect

    Rostoker, N.; Fisher, A.

    1986-01-01

    An intense neutralized ion beam can be injected and trapped in magnetic mirror or tokamak geometry. The details of the process involve beam polarization so that the beam crosses the fringing fields without deflection and draining the polarization when the beam reaches the plasma. Equilibrium requires that a large betatron field be added in tokamak geometry. In mirror geometry a toroidal field must be added by means of a current along the mirror axis. In either case, the geometry becomes that of the modified betatron which has been studied experimentally and theoretically in recent years. We consider beams of d and t ions with a mean energy of 500 kev and a temperature of about 50 kev. The plasma may be a proton plasma with cold ions. It is only necessary for beam trapping or to carry currents. The ion energy for slowing down is initially 500 kev and thermonuclear reactions depend only on the beam temperature of 50 kev which changes very slowly. This new configuration for magnetic confinement fusion leads to an energy gain of 10--20 for d-t reactions whereas previous studies of beam target interaction predicted a maximum energy gain of 3--4. The high beam energy available with pulsed ion diode technology is also essential for advanced fuels. 16 refs., 3 figs.

  12. Intense Pulsed Heavy Ion Beam Technology

    NASA Astrophysics Data System (ADS)

    Masugata, Katsumi; Ito, Hiroaki

    Development of intense pulsed heavy ion beam accelerator technology is described for the application of materials processing. Gas puff plasma gun and vacuum arc discharge plasma gun were developed as an active ion source for magnetically insulated pulsed ion diode. Source plasma of nitrogen and aluminum were successfully produced with the gas puff plasma gun and the vacuum arc plasma gun, respectively. The ion diode was successfully operated with gas puff plasma gun at diode voltage 190 kV, diode current 2.2 kA and nitrogen ion beam of ion current density 27 A/cm2 was obtained. The ion composition was evaluated by a Thomson parabola spectrometer and the purity of the nitrogen ion beam was estimated to be 86%. The diode also operated with aluminum ion source of vacuum arc plasma gun. The ion diode was operated at 200 kV, 12 kA, and aluminum ion beam of current density 230 A/cm2 was obtained. The beam consists of aluminum ions (Al(1-3)+) of energy 60-400 keV, and protons (90-130 keV), and the purity was estimated to be 89 %. The development of the bipolar pulse accelerator (BPA) was reported. A double coaxial type bipolar pulse generator was developed as the power supply of the BPA. The generator was tested with dummy load of 7.5 ohm, bipolar pulses of -138 kV, 72 ns (1st pulse) and +130 kV, 70 ns (2nd pulse) were succesively generated. By applying the bipolar pulse to the drift tube of the BPA, nitrogen ion beam of 2 A/cm2 was observed in the cathode, which suggests the bipolar pulse acceleration.

  13. Beam imaging diagnostics for heavy ion beam fusion experiments

    SciTech Connect

    Bieniosek, F.M.; Prost, L.; Ghiorso, W.

    2003-05-01

    We are developing techniques for imaging beams in heavy-ion beam fusion experiments in the HIF-VNL in 2 to 4 transverse dimensions. The beams in current experiments range in energy from 50 keV to 2 MeV, with beam current densities from <10 to 200 mA/cm{sup 2}, and pulse lengths of 4 to 20 {micro}s. The beam energy will range up to 10 MeV in near-future beam experiments. The imaging techniques, based on kapton films and optical scintillators, complement and, in some cases, may replace mechanical slit scanners. The kapton film images represent a time-integrated image on the film exposed to the beam. The optical scintillator utilizes glass and ceramic scintillator material imaged by a fast, image-intensified CCD-based camera. We will discuss the techniques, results, and plans for implementation of the diagnostics on the beam experiments.

  14. A Distributed Radiator, Heavy Ion Target with Realistic Ion Beams

    NASA Astrophysics Data System (ADS)

    Callahan, Debra A.; Tabak, Max

    1997-11-01

    Recent efforts in heavy ion target design have centered around the distributed radiator design of Tabak(M. Tabak, Bull. Am. Phys. Soc., Vol 41, No 7, 1996.). The initial distributed radiator target assumed beams with a uniform radial density distribution aimed directly along the z axis. Chamber propagation simulations indicate that the beam distribution is more nearly Gaussian at best focus. In addition, more than two beams will be necessary to carry the required current; this means that the beams must be angled to allow space for the final focusing systems upstream. We will describe our modifications to the distributed radiator target to allow realistic beams and realistic beam angles.

  15. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, Donald J.

    1988-01-01

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  16. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, D.J.

    1986-03-25

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  17. Infrared imaging diagnostics for INTF ion beam

    NASA Astrophysics Data System (ADS)

    Sudhir, D.; Bandyopadhyay, M.; Pandey, R.; Joshi, J.; Yadav, A.; Rotti, C.; Bhuyan, M.; Bansal, G.; Soni, J.; Tyagi, H.; Pandya, K.; Chakraborty, A.

    2015-04-01

    In India, testing facility named INTF [1] (Indian test facility) is being built in Institute for Plasma Research to characterize ITER-Diagnostic Neutral Beam (DNB). INTF is expected to deliver 60A negative hydrogen ion beam current of energy 100keV. The beam will be operated with 5Hz modulation having 3s ON/20s OFF duty cycle. To characterize the beam parameters several diagnostics are at different stages of design and development. One of them will be a beam dump, made of carbon fiber composite (CFC) plates placed perpendicular to the beam direction at a distance lm approximately. The beam dump needs to handle ˜ 6MW of beam power with peak power density ˜ 38.5MW/m2. The diagnostic is based on thermal (infra-red - IR) imaging of the footprint of the 1280 beamlets falling on the beam dump using four IR cameras from the rear side of the dump. The beam dump will be able to measure beam uniformity, beamlet divergence. It may give information on relative variation of negative ion stripping losses for different beam pulses. The design of this CFC based beam dump needs to address several physics and engineering issues, including some specific inputs from manufacturers. The manuscript will describe an overview of the diagnostic system and its design methodology highlighting those issues and the present status of its development.

  18. Plasma ion sources and ion beam technology inmicrofabrications

    SciTech Connect

    Ji, Lili

    2007-01-01

    For over decades, focused ion beam (FIB) has been playing a very important role in microscale technology and research, among which, semiconductor microfabrication is one of its biggest application area. As the dimensions of IC devices are scaled down, it has shown the need for new ion beam tools and new approaches to the fabrication of small-scale devices. In the meanwhile, nanotechnology has also deeply involved in material science research and bioresearch in recent years. The conventional FIB systems which utilize liquid gallium ion sources to achieve nanometer scale resolution can no longer meet the various requirements raised from such a wide application area such as low contamination, high throughput and so on. The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. In this thesis, three novel ion beam tools have been developed and investigated as the alternatives for the conventional FIB systems in some particular applications. An integrated focused ion beam (FIB) and scanning electron microscope (SEM) system has been developed for direct doping or surface modification. This new instrument employs a mini-RF driven plasma source to generate focused ion beam with various ion species, a FEI two-lens electron (2LE) column for SEM imaging, and a five-axis manipulator system for sample positioning. An all-electrostatic two-lens column has been designed to focus the ion beam extracted from the source. Based on the Munro ion optics simulation, beam spot sizes as small as 100 nm can be achieved at beam energies between 5 to 35 keV if a 5 μm-diameter extraction aperture is used. Smaller beam spot sizes can be obtained with smaller apertures at sacrifice of some beam current. The FEI 2LE column, which utilizes Schottky emission, electrostatic focusing optics, and stacked-disk column construction, can provide high-resolution (as small as 20 nm) imaging capability, with fairly long working distance (25

  19. Ion-beam technology and applications

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.; Robson, R. R.; Sovey, J. S.

    1977-01-01

    Ion propulsion research and development yields a mature technology that is transferable to a wide range of nonpropulsive applications, including terrestrial and space manufacturing. A xenon ion source was used for an investigation into potential ion-beam applications. The results of cathode tests and discharge-chamber experiments are presented. A series of experiments encompassing a wide range of potential applications is discussed. Two types of processes, sputter deposition, and erosion were studied. Some of the potential applications are thin-film Teflon capacitor fabrication, lubrication applications, ion-beam cleaning and polishing, and surface texturing.

  20. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Van Kampen, C. L.; Babbush, C. A.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic prosthesis fixation, and dental implants.

  1. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Babbush, C. A.; Vankampen, C. L.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic pros-thesis fixtion, and dental implants.

  2. Novel method for unambiguous ion identification in mixed ion beams extracted from an electron beam ion trap

    SciTech Connect

    Meissl, W.; Simon, M. C.; Crespo Lopez-Urrutia, J. R.; Tawara, H.; Ullrich, J.; Winter, HP.; Aumayr, F.

    2006-09-15

    A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an electron beam ion trap is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio.

  3. ION BEAM ETCHING EFFECTS IN BIOLOGICAL MICROANALYSIS

    EPA Science Inventory

    Oxygen ion beam sputter etching used in SIMS has been shown to produce morphologic effects which have similarities and differences in comparison to rf plasma etching of biological specimens. Sputter yield variations resulting from structural microheterogeneity are illustrated (e....

  4. Biomedical applications of ion-beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Gibbons, D. F.; Vankampen, C. L.; Babbush, C. A.

    1979-01-01

    Microscopically-rough surface texture of various biocompatible alloys and polymers produced by ion-beam sputtering may result in improvements in response of hard or soft tissue to various surgical implants.

  5. Ion Beam Scattering by Background Helium

    NASA Astrophysics Data System (ADS)

    Grillet, Anne; Hughes, Thomas; Boerner, Jeremiah

    2015-11-01

    The presence of background gases can cause charged particle beams to become more diffuse due to scattering. Calculations for the transport of an ion beam have been performed using Aleph, a particle-in-cell plasma modeling code, and verified against a general envelop equation for charged particle beams. We have investigated the influence of background helium on the coherence and transmitted current of the ion beam. Collisions between ions and neutral particles were calculated assuming isotropic elastic scattering. Since this tends to predict larger scattering angles than are expected at high energies, these are conservative estimates for beam scattering. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration.

  6. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1985-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  7. Beam dynamics in heavy ion induction LINACS

    SciTech Connect

    Smith, L.

    1981-10-01

    Interest in the use of an induction linac to accelerate heavy ions for the purpose of providing the energy required to initiate an inertially confined fusion reaction has stimulated a theoretical effort to investigate various beam dynamical effects associated with high intensity heavy ion beams. This paper presents a summary of the work that has been done so far; transverse, longitudinal and coupled longitudinal transverse effects are discussed.

  8. Ion beam processing of advanced electronic materials

    SciTech Connect

    Cheung, N.W.; Marwick, A.D.; Roberto, J.B.; International Business Machines Corp., Yorktown Heights, NY . Thomas J. Watson Research Center; Oak Ridge National Lab., TN )

    1989-01-01

    This report contains research programs discussed at the materials research society symposia on ion beam processing of advanced electronic materials. Major topics include: shallow implantation and solid-phase epitaxy; damage effects; focused ion beams; MeV implantation; high-dose implantation; implantation in III-V materials and multilayers; and implantation in electronic materials. Individual projects are processed separately for the data bases. (CBS)

  9. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1984-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  10. Superintense ion beam with high energy density

    NASA Astrophysics Data System (ADS)

    Dudnikov, Vadim; Dudnikova, Galina

    2008-04-01

    The energy density of ion beam accumulated in a storage ring can be increased dramatically with using of space charge compensation as was demonstrated in experiments [1]. The intensity of said superintense beam can be far greater than a space charge limit without space charge compensation. The model of secondary plasma build up with secondary ion-electron emission as a source of delayed electrons has been presented and discussed. This model can be used for explanation of bunched beam instability with electron surviving after gap, for prediction of e-cloud generation in coasting and long bunches beam, and can be important for pressure rise in worm and cold sections of storage rings. A fast desorption by ion of physically adsorbed molecules can explain a ``first pulse Instability''. Application of this model for e-p instability selfstabilization and superintense circulating beam accumulation is considered. Importance of secondary plasma for high perveance ion beam stabilization in ion implantation will be considered. Preliminary results of simulation of electron and ion accumulation will be presented. [1]. Belchenko et al., Xth International Particle Accelerator Conference, Protvino, 1977, Vol. 2, p. 287.

  11. A pencil beam algorithm for helium ion beam therapy

    SciTech Connect

    Fuchs, Hermann; Stroebele, Julia; Schreiner, Thomas; Hirtl, Albert; Georg, Dietmar

    2012-11-15

    Purpose: To develop a flexible pencil beam algorithm for helium ion beam therapy. Dose distributions were calculated using the newly developed pencil beam algorithm and validated using Monte Carlo (MC) methods. Methods: The algorithm was based on the established theory of fluence weighted elemental pencil beam (PB) kernels. Using a new real-time splitting approach, a minimization routine selects the optimal shape for each sub-beam. Dose depositions along the beam path were determined using a look-up table (LUT). Data for LUT generation were derived from MC simulations in water using GATE 6.1. For materials other than water, dose depositions were calculated by the algorithm using water-equivalent depth scaling. Lateral beam spreading caused by multiple scattering has been accounted for by implementing a non-local scattering formula developed by Gottschalk. A new nuclear correction was modelled using a Voigt function and implemented by a LUT approach. Validation simulations have been performed using a phantom filled with homogeneous materials or heterogeneous slabs of up to 3 cm. The beams were incident perpendicular to the phantoms surface with initial particle energies ranging from 50 to 250 MeV/A with a total number of 10{sup 7} ions per beam. For comparison a special evaluation software was developed calculating the gamma indices for dose distributions. Results: In homogeneous phantoms, maximum range deviations between PB and MC of less than 1.1% and differences in the width of the distal energy falloff of the Bragg-Peak from 80% to 20% of less than 0.1 mm were found. Heterogeneous phantoms using layered slabs satisfied a {gamma}-index criterion of 2%/2mm of the local value except for some single voxels. For more complex phantoms using laterally arranged bone-air slabs, the {gamma}-index criterion was exceeded in some areas giving a maximum {gamma}-index of 1.75 and 4.9% of the voxels showed {gamma}-index values larger than one. The calculation precision of the

  12. A synchronous beam sweeper for heavy ions

    SciTech Connect

    Bogaty, J.M.

    1989-01-01

    The Argonne Tandem Linac Accelerator System (ATLAS) facility at Argonne National Laboratory provides a wide range of accelerated heavy ions from the periodic table. Frequently, the beam delivery rate of 12 MHz is too fast for the type of experiment on line. Reaction by-products from a target bombardment may have a decay interval much longer than the dead time between beam bunches. To prevent data from being corrupted by incoming ions a beam sweeper was developed which synchronously eliminates selected beam bunches to suit experimental needs. As the SWEEPER is broad band (DC to 6 MHz) beam delivery rates can be instantaneously changed. Ion beam bunches are selectively kicked out by an electrostatic dipole electrode pulsed to 2 kVDC. The system has been used for almost three years with several hundred hours of operating time logged to date. Beam bunch delivery rates of 6 MHz down to 25 kHz have been provided. Since this is a non-resonant system any beam delivery rate from 6 MHz down to zero can be set. In addition, burst modes have been used where beam is supplied in 12 MHz bursts and then shut down for a period of time set by the user. 3 figs.

  13. Thermoacoustic imaging using heavy ion beams

    SciTech Connect

    Claytor, T.N.; Tesmer, J.R.; Deemer, B.C.; Murphy, J.C.

    1995-10-01

    Ion beams have been used for surface modification, semiconductor device fabrication and for material analysis, which makes ion-material interactions of significant importance. Ion implantation will produce new compositions near the surface by ion mixing or directly by implanting desired ions. Ions exchange their energy to the host material as they travel into the material by several different processes. High energy ions ionize the host atoms before atomic collisions transfer the remaining momentum and stop the incident ion. As they penetrate the surface, the low energy ions ionize the host atoms, but also have a significantly large momentum transfer mechanism near the surface of the material. This leads to atoms, groups of atoms and electrons being ejected from the surface, which is the momentum transfer process of sputtering. This talk addresses the acoustic waves generated during ion implantation using modulated heavy ion beams. The mechanisms for elastic wave generation during ion implantation, in the regimes where sputtering is significant and where implantation is dominant and sputtering is negligible, has been studied. The role of momentum transfer and thermal energy production during ion implantation was compared to laser generated elastic waves in an opaque solid as a reference, since laser generated ultrasound has been extensively studied and is fairly well understood. The thermoelastic response dominated in both high and low ion energy regimes since, apparently, more energy is lost to thermal heat producing mechanisms than momentum transfer processes. The signal magnitude was found to vary almost linearly with incident energy as in the laser thermoelastic regime. The time delays for longitudinal and shear waves-were characteristic of those expected for a purely thermal heating source. The ion beams are intrinsically less sensitive to the albedo of the surface.

  14. Beam current controller for laser ion source

    SciTech Connect

    Okamura, Masahiro

    2014-10-28

    The present invention relates to the design and use of an ion source with a rapid beam current controller for experimental and medicinal purposes. More particularly, the present invention relates to the design and use of a laser ion source with a magnetic field applied to confine a plasma flux caused by laser ablation.

  15. Graphene engineering by neon ion beams

    DOE PAGESBeta

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphenemore » based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.« less

  16. Mass spectrometer and methods of increasing dispersion between ion beams

    DOEpatents

    Appelhans, Anthony D.; Olson, John E.; Delmore, James E.

    2006-01-10

    A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sector being used as a dispersive element following magnetic separation of the plurality of ion beams. Other apparatus and methods are provided.

  17. The role of space charge compensation for ion beam extraction and ion beam transport (invited)

    SciTech Connect

    Spädtke, Peter

    2014-02-15

    Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation.

  18. Upgoing ion beams. I - Microscopic analysis

    NASA Astrophysics Data System (ADS)

    Kaufmann, R. L.; Kintner, P. M.

    1982-12-01

    The stability of electrostatic waves with frequencies near the hydrogen cyclotron frequency is investigated for an auroral plasma containing an ion beam by studying the relationship between low-frequency waves (0-1 kHz) and particles seen by the S3-3 satellite. It is concluded that only electrostatic hydrogen ion cyclotron (EHC) waves can be generated at the observed frequencies by the observed energetic particles, with the waves being produced either by drifting electrons or by the ion beam. In the model developed, ion beams are seen with their observed temperatures because they have evolved to a weakly unstable configuration in which the wave growth length is comparable to the width of the beam region. Waves are well confined to the beams because they are damped rapidly in the adjacent plasma, and the mirror effect can maintain a weak instability over a considerable altitude range. It is proposed that this effect is a source for strong pitch angle scattering, as well as an explanation for the nonexistence of downgoing ion beams.

  19. Laser-cooled continuous ion beams

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    A collaboration with a group in Arhus, Denmark, using their storage ring ASTRID, brought about better understanding of ion beams cooled to very low temperatures. The longitudinal Schottky fluctuation noise signals from a cooled beam were studied. The fluctuation signals are distorted by the effects of space charge as was observed in earlier measurements at other facilities. However, the signal also exhibits previously unobserved coherent components. The ions` velocity distribution, measured by a laser fluorescence technique suggests that the coherence is due to suppression of Landau damping. The observed behavior has important implications for the eventual attainment of a crystalline ion beam in a storage ring. A significant issue is the transverse temperature of the beam -- where no direct diagnostics are available and where molecular dynamics simulations raise interesting questions about equilibrium.

  20. Ion sources and targets for radioactive beams

    SciTech Connect

    Schiffer, J.P.; Back, B.B.; Ahmad, I.

    1995-08-01

    A high-intensity ISOL-type radioactive beam facility depends critically on the performance of the target/ion source system. We developed a concept for producing high-intensity secondary beams of fission fragments, such as {sup 132}Sn, using a two-part target and ion source combination. The idea involves stopping a 1000-kW beam of 200-MeV deuterons in a target of Be or U to produce a secondary beam of neutrons. Just behind the neutron production target is a second target, typically a porous form of UC, coupled to an ISOL-type ion source. In December 1994, we tested this concept with 200-MeV deuterons at low intensity in an experiment at the NSCL. The yields of characteristic gamma rays were measured and confirmed our predictions.

  1. Precise formation of geometrically focused ion beams

    SciTech Connect

    Davydenko, V.I.; Ivanov, A.A.; Korepanov, S.A.; Kotelnikov, I.A.

    2006-03-15

    Geometrically focused intense neutral beams for plasma diagnostic consist of many elementary beams formed by a multiaperture ion-optical system and aimed at the focal point. In real conditions, some of the elementary beams may have increased angular divergence and/or deviate from the intended direction, thus diminishing the neutral beam density at the focus. Several improvements to the geometrical focusing are considered in the article including flattening of the plasma profile across the emission surface, using of quasi-Pierce electrodes at the beam periphery, and minimizing the deviation of the electrodes from the spherical form. Application of these measures to the neutral beam Russian diagnostic injector developed in Budker Institute of Nuclear Physics allows an increase of neutral beam current density in the focus by {approx}50%.

  2. Ion beams from laser-generated plasmas

    NASA Technical Reports Server (NTRS)

    Hughes, R. H.; Anderson, R. J.; Gray, L. G.; Rosenfeld, J. P.; Manka, C. K.; Carruth, M. R.

    1980-01-01

    The paper describes the space-charge-limited beams produced by the plasma blowoffs generated by 20-MW bursts of 1.06-micron radiation from an active Q-switched Nd:YAG laser. Laser power densities near 10 to the 11th/sq cm on solid targets generate thermalized plasma plumes which drift to a 15-kV gridded extraction gap where the ions are extracted, accelerated, and electrostatically focused; the spatially defined ion beams are then magnetically analyzed to determine the charge state content in the beams formed from carbon, aluminum, copper, and lead targets. This technique preserves time-of-flight (TOF) information in the plasma drift region, which permits plasma ion temperatures and mass flow velocities to be determined from the Maxwellian ion curve TOF shapes for the individual charge species.

  3. Ion beam driven warm dense matter experiments

    NASA Astrophysics Data System (ADS)

    Bieniosek, F. M.; Ni, P. A.; Leitner, M.; Roy, P. K.; More, R.; Barnard, J. J.; Kireeff Covo, M.; Molvik, A. W.; Yoneda, H.

    2007-11-01

    We report plans and experimental results in ion beam-driven warm dense matter (WDM) experiments. Initial experiments at LBNL are at 0.3-1 MeV K+ beam (below the Bragg peak), increasing toward the Bragg peak in future versions of the accelerator. The WDM conditions are envisioned to be achieved by combined longitudinal and transverse neutralized drift compression to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. Initial experiments include an experiment to study transient darkening at LBNL; and a porous target experiment at GSI heated by intense heavy-ion beams from the SIS 18 storage ring. Further experiments will explore target temperature and other properties such as electrical conductivity to investigate phase transitions and the critical point.

  4. High current ion beam transport using solenoids

    SciTech Connect

    Hollinger, R.; Spaedtke, P.

    2008-02-15

    In the framework of the future project FAIR several upgrade programs and construction of new facilities are in progress such as the U{sup 4+} upgrade for the existing high current injector and the new 70 MeV proton injector. For both injectors solenoids in the low energy beam transport section are foreseen to inject the beam into the following rf accelerator. The paper presents beam quality measurements of high current ion beams behind a solenoid using a slit-grid emittance measurement device, viewing targets, and a pepper pot measurement device at the high current test bench at GSI.

  5. Electron Cooling of Intense Ion Beam

    SciTech Connect

    Dietrich, J.; Kamerdjiev, V.; Maier, R.; Prasuhn, D.; Stein, J.; Stockhorst, H.; Korotaev, Yu.; Meshkov, I.; Sidorin, A.; Smirnov, A.

    2006-03-20

    Results of experimental studies of the electron cooling of a proton beam at COSY (Juelich, Germany) are presented. Intensity of the proton beam is limited by two general effects: particle loss directly after the injection and development of instability in a deep cooled ion beam. Results of the instability investigations performed at COSY during last years are presented in this report in comparison with previous results from HIMAC (Chiba, Japan) CELSIUS (Uppsala, Sweden) and LEAR (CERN). Methods of the instability suppression, which allow increasing the cooled beam intensity, are described. This work is supported by RFBR grant no. 05-02-16320 and INTAS grant no. 03-54-5584.

  6. Rhenium ion beam for implantation into semiconductors

    SciTech Connect

    Kulevoy, T. V.; Seleznev, D. N.; Alyoshin, M. E.; Kraevsky, S. V.; Yakushin, P. E.; Khoroshilov, V. V.; Gerasimenko, N. N.; Smirnov, D. I.; Fedorov, P. A.; Temirov, A. A.

    2012-02-15

    At the ion source test bench in Institute for Theoretical and Experimental Physics the program of ion source development for semiconductor industry is in progress. In framework of the program the Metal Vapor Vacuum Arc ion source for germanium and rhenium ion beam generation was developed and investigated. It was shown that at special conditions of ion beam implantation it is possible to fabricate not only homogenous layers of rhenium silicides solid solutions but also clusters of this compound with properties of quantum dots. At the present moment the compound is very interesting for semiconductor industry, especially for nanoelectronics and nanophotonics, but there is no very developed technology for production of nanostructures (for example quantum sized structures) with required parameters. The results of materials synthesis and exploration are presented.

  7. Proposed LLNL electron beam ion trap

    SciTech Connect

    Marrs, R.E.; Egan, P.O.; Proctor, I.; Levine, M.A.; Hansen, L.; Kajiyama, Y.; Wolgast, R.

    1985-07-02

    The interaction of energetic electrons with highly charged ions is of great importance to several research fields such as astrophysics, laser fusion and magnetic fusion. In spite of this importance there are almost no measurements of electron interaction cross sections for ions more than a few times ionized. To address this problem an electron beam ion trap (EBIT) is being developed at LLNL. The device is essentially an EBIS except that it is not intended as a source of extracted ions. Instead the (variable energy) electron beam interacting with the confined ions will be used to obtain measurements of ionization cross sections, dielectronic recombination cross sections, radiative recombination cross sections, energy levels and oscillator strengths. Charge-exchange recombinaion cross sections with neutral gasses could also be measured. The goal is to produce and study elements in many different charge states up to He-like xenon and Ne-like uranium. 5 refs., 2 figs.

  8. Medical applications of ion beam processes

    NASA Astrophysics Data System (ADS)

    Sioshansi, P.

    The use of ions beams for treatment of surfaces in medical prostheses has gained increasing interest in the past few years. The application of ion beams has taken different forms: (1) ion implantation has been used for increasing the hardness and wear resistance of the new generation titanium based alloys, as well as reducing the wear of the mating polyethylene component used in orthopedic total joint replacement. Spire Corporation has been successful in commercializing ion implantation technology and is processing several thousand artificial knees and hips per year. (Spire uses the tradename IONGUARD™ for this application.) (2) Similarly, ion implantation has proven to be very effective for increasing the corrosion resistance of the Co-Cr based alloys that have traditionally been used in orthopedic prostheses. This application should be of particular interest in resolving the issues surrounding ion release problems associated with these alloys. (3) Ion beam etching/milling has been used for producing a highly textured surface for tissue ingrowth in applications ranging from porous orthopedic implants and percutaneous devices to artificial skin and the process should have a significant impact in this application. (4) There are indications that ion implantation is a useful process for increasing biocompatibility and tissue attachment on metallic samples. This subject deserves considerable attention in the coming years.

  9. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanisms and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  10. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanism and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  11. Multiple Electron Stripping of Heavy Ion Beams

    SciTech Connect

    D. Mueller; L. Grisham; I. Kaganovich; R. L. Watson; V. Horvat; K. E. Zaharakis; Y. Peng

    2002-06-25

    One approach being explored as a route to practical fusion energy uses heavy ion beams focused on an indirect drive target. Such beams will lose electrons while passing through background gas in the target chamber, and therefore it is necessary to assess the rate at which the charge state of the incident beam evolves on the way to the target. Accelerators designed primarily for nuclear physics or high energy physics experiments utilize ion sources that generate highly stripped ions in order to achieve high energies economically. As a result, accelerators capable of producing heavy ion beams of 10 to 40 Mev/amu with charge state 1 currently do not exist. Hence, the stripping cross-sections used to model the performance of heavy ion fusion driver beams have, up to now, been based upon theoretical calculations. We have investigated experimentally the stripping of 3.4 Mev/amu Kr 7+ and Xe +11 in N2; 10.2 MeV/amu Ar +6 in He, N2, Ar and Xe; 19 MeV/amu Ar +8 in He, N2, Ar and Xe; 30 MeV He 1 + in He, N2, Ar and Xe; and 38 MeV/amu N +6 in He, N2, Ar and Xe. The results of these measurements are compared with the theoretical calculations to assess their applicability over a wide range of parameters.

  12. Beam loss studies in high-intensity heavy-ion linacs

    NASA Astrophysics Data System (ADS)

    Ostroumov, P. N.; Aseev, V. N.; Mustapha, B.

    2004-09-01

    The proposed Rare Isotope Accelerator (RIA) Facility, an innovative exotic-beam facility for the production of high-quality beams of short-lived isotopes, consists of a fully superconducting 1.4GV driver linac and a 140MV postaccelerator. To produce sufficient intensities of secondary beams the driver linac will provide 400kW primary beams of any ion from hydrogen to uranium. Because of the high intensity of the primary beams the beam losses must be minimized to avoid radioactivation of the accelerator equipment. To keep the power deposited by the particles lost on the accelerator structures below 1 W/m, the relative beam losses per unit length should be less than 10-5, especially along the high-energy section of the linac. A new beam dynamics simulation code TRACK has been developed and used for beam loss studies in the RIA driver linac. In the TRACK code, ions are tracked through the three-dimensional electromagnetic fields of every element of the linac starting from the electron cyclotron resonance (ECR) ion source to the production target. The simulation starts with a multicomponent dc ion beam extracted from the ECR. The space charge forces are included in the simulations. They are especially important in the front end of the driver linac. Beam losses are studied by tracking a large number of particles (up to 106) through the whole linac considering all sources of error such us element misalignments, rf field errors, and stripper thickness fluctuations. For each configuration of the linac, multiple sets of error values have been randomly generated and used in the calculations. The results are then combined to calculate important beam parameters, estimate beam losses, and characterize the corresponding linac configuration. To track a large number of particles for a comprehensive number of error sets (up to 500), the code TRACK was parallelized and run on the Jazz computer cluster at ANL.

  13. Resonant Ionization Laser Ion Source for Radioactive Ion Beams

    SciTech Connect

    Liu, Yuan; Beene, James R; Havener, Charles C; Vane, C Randy; Gottwald, T.; Wendt, K.; Mattolat, C.; Lassen, J.

    2009-01-01

    A resonant ionization laser ion source based on all-solid-state, tunable Ti:Sapphire lasers is being developed for the production of pure radioactive ion beams. It consists of a hot-cavity ion source and three pulsed Ti:Sapphire lasers operating at a 10 kHz pulse repetition rate. Spectroscopic studies are being conducted to develop ionization schemes that lead to ionizing an excited atom through an auto-ionization or a Rydberg state for numerous elements of interest. Three-photon resonant ionization of 12 elements has been recently demonstrated. The overall efficiency of the laser ion source measured for some of these elements ranges from 1 to 40%. The results indicate that Ti:Sapphire lasers could be well suited for laser ion source applications. The time structures of the ions produced by the pulsed lasers are investigated. The information may help to improve the laser ion source performance.

  14. Variable-spot ion beam figuring

    NASA Astrophysics Data System (ADS)

    Wu, Lixiang; Qiu, Keqiang; Fu, Shaojun

    2016-03-01

    This paper introduces a new scheme of ion beam figuring (IBF), or rather variable-spot IBF, which is conducted at a constant scanning velocity with variable-spot ion beam collimated by a variable diaphragm. It aims at improving the reachability and adaptation of the figuring process within the limits of machine dynamics by varying the ion beam spot size instead of the scanning velocity. In contrast to the dwell time algorithm in the conventional IBF, the variable-spot IBF adopts a new algorithm, which consists of the scan path programming and the trajectory optimization using pattern search. In this algorithm, instead of the dwell time, a new concept, integral etching time, is proposed to interpret the process of variable-spot IBF. We conducted simulations to verify its feasibility and practicality. The simulation results indicate the variable-spot IBF is a promising alternative to the conventional approach.

  15. Neutral Beam Ion Loss Modeling for NSTX

    SciTech Connect

    D. Mikkelsen; D.S. Darrow; L. Grisham; R. Akers; S. Kaye

    1999-06-01

    A numerical model, EIGOL, has been developed to calculate the loss rate of neutral beam ions from NSTX and the resultant power density on the plasma facing components. This model follows the full gyro-orbit of the beam ions, which can be a significant fraction of the minor radius. It also includes the three-dimensional structure of the plasma facing components inside NSTX. Beam ion losses from two plasma conditions have been compared: {beta} = 23%, q{sub 0} = 0.8, and {beta} = 40%, q{sub 0} = 2.6. Global losses are computed to be 4% and 19%, respectively, and the power density on the rf antenna is near the maximum tolerable levels in the latter case.

  16. Probe measurements in ion-beam plasma

    SciTech Connect

    Dudin, S.V.

    1994-12-31

    The particularities of the electric probe measurements in the ion-beam plasma (IBP) have been investigated. To find the electron density n{sub e} and temperature T{sub c} as well as electron energy distribution it is necessary to separate electron current from full probe current, because ion part of this current is often large enough to mask the electron part. According to collisionless probe theory, radius of ion layer in strongly non-isothermal plasma (as in their case) and consequently the ion current are determined by Child`s law. However, at presence of ion beam with high enough energy {var_epsilon}{sub b} >> e{var_phi}{sub p}, this law is broken. The author has found the dependence of Langmuir probe ion current I{sub i} on probe potential {var_phi}{sub p} at presence of IB. The constant ion density approach was used in cylindrical and spherical geometry of the probe layer. Dependence of ion current founded experimentally accords with Child`s law when the probe is placed outside the beam and linear--within the beam. Application of only the chemical Langmuir probe is insufficient for energoanalysis of IBP electrons because of ion current interference. To solve this problem combination of the techniques of cylindrical probe, large plate probe (5 x 5mm) and two-grid energoanalyzer was used. Design and parameters of the two-grid analyzer are presented. Measuring system is described for determination of electron energy distribution function in low temperature plasma by double differentiation of the electric probe volt-ampere characteristic by modulation method.

  17. Ion beam lithography with gold and silicon ions

    NASA Astrophysics Data System (ADS)

    Seniutinas, Gediminas; Balčytis, Armandas; Nishijima, Yoshiaki; Nadzeyka, Achim; Bauerdick, Sven; Juodkazis, Saulius

    2016-04-01

    Different ion species deliver a different material sputtering yield and implantation depth, thus enabling focused ion beam (FIB) fabrication for diverse applications. Using newly developed FIB milling with double charged hbox {Au}^{2+} and hbox {Si}^{2+} ions, fabrication has been carried out on Au-sputtered films to define arrays of densely packed nanoparticles supporting optical extinction peaks at visible-IR wavelengths determined by the size, shape, and proximity of nanoparticles. Results are qualitatively compared with hbox {Ga}+ milling. A possibility to use such ion implantation to tailor the etching rate of silicon is also demonstrated.

  18. Scanning He+ Ion Beam Microscopy and Metrology

    SciTech Connect

    Joy, David C.

    2011-11-10

    The CD-SEM has been the tool of choice for the imaging and metrology of semiconductor devices for the past three decades but now, with critical dimensions at the nanometer scale, electron beam instruments can no longer deliver adequate performance. A scanning microscope using a He+ ion beam offers superior resolution and depth of field, and provides enhanced imaging contrast. Device metrology performed using ion beam imaging produces data which is comparable to or better than that from a conventional CD-SEM although there are significant differences in the experimental conditions required and in the details of image formation. The charging generated by a He+ beam, and the sample damage that it can cause, require care in operation but are not major problems.

  19. Plasma focus ion beam-scaling laws

    NASA Astrophysics Data System (ADS)

    Saw, S. H.

    2014-08-01

    Measurements on plasma focus ion beams include various advanced techniques producing a variety of data which has yet to produce benchmark numbers. Recent numerical experiments using an extended version of the Lee Code has produced reference numbers and scaling trends for number and energy fluence of deuteron beams as functions of stored energy E0. At the pinch exit the ion number fluence (ions m-2) and energy fluence (J m-2) computed as 2.4-7.8×1020 and 2.2-33×106 respectively were found to be independent of E0 from 0.4 - 486 kJ. This work was extended to the ion beams for various gases. The results show that, for a given plasma focus, the fluence, flux, ion number and ion current decrease from the lightest to the heaviest gas except for trend-breaking higher values for Ar fluence and flux. The energy fluence, energy flux, power flow and damage factors are relatively constant from H2 to N2 but increase for Ne, Ar, Kr and Xe due to radiative cooling and collapse effects. This paper reviews this work and in a concluding section attempts to put the accumulating large amounts of data into the form of a scaling law of beam energy Ebeam versus storage energy E0 taking the form for deuteron as: {Ebeam} = 18.2{E}01.23; where Ebeam is in J and E0 is in kJ. It is hoped that the establishment of such scaling laws places on a firm footing the reference quantitative ideas for plasma focus ion beams.

  20. Synthesis of Lithium Boracarbonate Ion Pairs by Copper-Catalyzed Multi-Component Coupling of Carbon Dioxide, Diboron, and Aldehydes.

    PubMed

    Carry, Béatrice; Zhang, Liang; Nishiura, Masayoshi; Hou, Zhaomin

    2016-05-17

    The catalytic selective multi-component coupling of CO2 , bis(pinacolato)diboron, LiOtBu, and a wide range of aldehydes has been achieved for the first time by using an NHC-copper catalyst. This transformation has efficiently afforded a series of novel lithium cyclic boracarbonate ion pair compounds in high yields from readily available starting materials. This protocol has not only provided a new catalytic process for the utilization of CO2 , but it has also constituted a novel route for the efficient synthesis of a new class of lithium borate compounds that might be of interest as potential electrolyte candidates for lithium ion batteries. PMID:27061244

  1. High-powered pulsed-ion-beam acceleration and transport

    SciTech Connect

    Humphries, S. Jr.; Lockner, T.R.

    1981-11-01

    The state of research on intense ion beam acceleration and transport is reviewed. The limitations imposed on ion beam transport by space charge effects and methods available for neutralization are summarized. The general problem of ion beam neutralization in regions free of applied electric fields is treated. The physics of acceleration gaps is described. Finally, experiments on multi-stage ion acceleration are summarized.

  2. Beam Control for Ion Induction Accelerators

    SciTech Connect

    Sangster, T.C.; Ahle, L.

    2000-02-17

    Coordinated bending and acceleration of an intense space-charge-dominated ion beam has been achieved for the first time. This required the development of a variable waveform, precision, bi-polar high voltage pulser and a precision, high repetition rate induction core modulator. Waveforms applied to the induction cores accelerate the beam as the bi-polar high voltage pulser delivers a voltage ramp to electrostatic dipoles which bend the beam through a 90 degree permanent magnet quadrupole lattice. Further work on emittance minimization is also reported.

  3. ALLIGATOR - An apparatus for ion beam assisted deposition with a broad-beam ion source

    NASA Astrophysics Data System (ADS)

    Wituschek, H.; Barth, M.; Ensinger, W.; Frech, G.; Rück, D. M.; Leible, K. D.; Wolf, G. K.

    1992-04-01

    Ion beam assisted deposition is a versatile technique for preparing thin films and coatings for various applications. Up to now a prototype setup for research purposes has been used in our laboratory. Processing of industrial standard workpieces requires a high current ion source with broad beam and high uniformity for homogeneous bombardment. In this contribution a new apparatus for large area samples will be described. It is named ALLIGATOR (German acronym of facility for ion assisted evaporation on transverse movable or rotary targets). In order to have a wide energy range available two ion sources are used. One delivers a beam energy up to 1.3 keV. The other is suitable for energies from 5 keV up to 40 keV. The ``high-energy'' ion source is a multicusp multiaperture source with 180-mA total current and a beam diameter of 280 mm at the target position.

  4. Beam dynamics in heavy ion fusion

    SciTech Connect

    Seidl, P.

    1995-04-01

    A standard design for heavy ion fusion drivers under study in the US is an induction linac with electrostatic focusing at low energy and magnetic focusing at higher energy. The need to focus the intense beam to a few-millimeter size spot at the deuterium-tritium target establishes the emittance budget for the accelerator. Economic and technological considerations favor a larger number of beams in the low-energy, electrostatic-focusing section than in the high-energy, magnetic-focusing section. Combining four beams into a single focusing channel is a viable option, depending on the growth in emittance due to the combining process. Several significant beam dynamics issues that are, or have been, under active study are discussed: large space charge and image forces, beam wall clearances, halos, alignment, longitudinal instability, and bunch length control.

  5. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Chang, O.; Wang, J.

    2011-05-20

    Full particle PIC simulations are performed to study the neutralization of an ion beam in the cohesionless, mesothermal regime. Simulations further confirmed that neutralization is achieved through interactions between the trapped electrons and the potential well established by the propagation of the beam front along the beam direction and is not through plasma instabilities as previous studies suggested. In the transverse direction, the process is similar to that of the expansion of mesothermal plasma into vacuum. Parametric simulations are also performed to investigate the effects of beam radius and domain boundary condition on the neutralization process. The results suggests that, while the qualitative behavior may be similar in ground tests, quantitative parameters such as the beam potential will be affected significantly by the vacuum chamber because of the limits imposed on the expansion process by the finite chamber space.

  6. Using neutral beams as a light ion beam probe (invited)

    SciTech Connect

    Chen, Xi; Heidbrink, W. W.; Van Zeeland, M. A.; Pace, D. C.; Petty, C. C.; Fisher, R. K.; Kramer, G. J.; Nazikian, R.; Austin, M. E.; Hanson, J. M.; Zeng, L.

    2014-11-15

    By arranging the particle first banana orbits to pass near a distant detector, the light ion beam probe (LIBP) utilizes orbital deflection to probe internal fields and field fluctuations. The LIBP technique takes advantage of (1) the in situ, known source of fast ions created by beam-injected neutral particles that naturally ionize near the plasma edge and (2) various commonly available diagnostics as its detector. These born trapped particles can traverse the plasma core on their inner banana leg before returning to the plasma edge. Orbital displacements (the forces on fast ions) caused by internal instabilities or edge perturbing fields appear as modulated signal at an edge detector. Adjustments in the q-profile and plasma shape that determine the first orbit, as well as the relative position of the source and detector, enable studies under a wide variety of plasma conditions. This diagnostic technique can be used to probe the impact on fast ions of various instabilities, e.g., Alfvén eigenmodes (AEs) and neoclassical tearing modes, and of externally imposed 3D fields, e.g., magnetic perturbations. To date, displacements by AEs and by externally applied resonant magnetic perturbation fields have been measured using a fast ion loss detector. Comparisons with simulations are shown. In addition, nonlinear interactions between fast ions and independent AE waves are revealed by this technique.

  7. Production of highly charged ion beams from ECR ion sources

    SciTech Connect

    Xie, Z.Q.

    1997-09-01

    Electron Cyclotron Resonance (ECR) ion source development has progressed with multiple-frequency plasma heating, higher mirror magnetic fields and better technique to provide extra cold electrons. Such techniques greatly enhance the production of highly charged ions from ECR ion sources. So far at cw mode operation, up to 300 e{mu}A of O{sup 7+} and 1.15 emA of O{sup 6+}, more than 100 e{mu}A of intermediate heavy ions for charge states up to Ar{sup 13+}, Ca{sup 13+}, Fe{sup 13+}, Co{sup 14+} and Kr{sup 18+}, and tens of e{mu}A of heavy ions with charge states to Kr{sup 26+}, Xe{sup 28+}, Au{sup 35+}, Bi{sup 34+} and U{sup 34+} have been produced from ECR ion sources. At an intensity of at least 1 e{mu}A, the maximum charge state available for the heavy ions are Xe{sup 36+}, Au{sup 46+}, Bi{sup 47+} and U{sup 48+}. An order of magnitude enhancement for fully stripped argon ions (I {ge} 60 enA) also has been achieved. This article will review the ECR ion source progress and discuss key requirement for ECR ion sources to produce the highly charged ion beams.

  8. Physics with fast molecular-ion beams

    SciTech Connect

    Kanter, E.P.

    1980-01-01

    Fast (MeV) molecular-ion beams provide a unique source of energetic projectile nuclei which are correlated in space and time. The recognition of this property has prompted several recent investigations of various aspects of the interactions of these ions with matter. High-resolution measurements on the fragments resulting from these interactions have already yielded a wealth of new information on such diverse topics as plasma oscillations in solids and stereochemical structures of molecular ions as well as a variety of atomic collision phenomena. The general features of several such experiments will be discussed and recent results will be presented.

  9. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  10. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, Bruce C.; Stutz, Roger A.

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  11. Graphene engineering by neon ion beams.

    PubMed

    Iberi, Vighter; Ievlev, Anton V; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V; Joy, David C; Rondinone, Adam J; Belianinov, Alex; Ovchinnikova, Olga S

    2016-03-29

    Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He(+) and Ne(+) beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne(+) beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface. PMID:26890062

  12. Metal assisted focused-ion beam nanopatterning

    NASA Astrophysics Data System (ADS)

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates.

  13. Metal assisted focused-ion beam nanopatterning.

    PubMed

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates. PMID:27479713

  14. Graphene engineering by neon ion beams

    NASA Astrophysics Data System (ADS)

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-03-01

    Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne+ beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface.

  15. BEARS: Radioactive ion beams at LBNL

    SciTech Connect

    Powell, J.; Guo, F.Q.; Haustein, P.E.

    1998-07-01

    BEARS (Berkeley Experiments with Accelerated Radioactive Species) is an initiative to develop a radioactive ion-beam capability at Lawrence Berkeley National Laboratory. The aim is to produce isotopes at an existing medical cyclotron and to accelerate them at the 88 inch Cyclotron. To overcome the 300-meter physical separation of these two accelerators, a carrier-gas transport system will be used. At the terminus of the capillary, the carrier gas will be separated and the isotopes will be injected into the 88 inch Cyclotron`s Electron Cyclotron Resonance (ECR) ion source. The first radioactive beams to be developed will include 20-min {sup 11}C and 70-sec {sup 14}O, produced by (p,n) and (p,{alpha}) reactions on low-Z targets. A test program is currently being conducted at the 88 inch Cyclotron to develop the parts of the BEARS system. Preliminary results of these tests lead to projections of initial {sup 11}C beams of up to 2.5 {times} 10{sup 7} ions/sec and {sup 14}O beams of 3 {times} 10{sup 5} ions/sec.

  16. Electron beam ion sources and traps (invited)

    NASA Astrophysics Data System (ADS)

    Becker, Reinard

    2000-02-01

    The electron beam method of stepwise ionization to highest charge states has found applications in electron beam ion sources (EBISs) for accelerators and atomic physics collision experiments as well as in electron beam ion traps (EBITs) for x-ray and mass spectroscopy. A dense and almost monoenergetic electron beam provides a unique tool for ionization, because radiative recombination by slow electrons is negligible and charge exchange is almost avoided in ultrahigh vacua. These are essential differences to electron cyclotron resonance ion sources with inevitable low energy electrons and comparatively high gas pressure. The distinction between EBIS and EBIT as genuine devices has become meaningless, because EBISs may work as traps and almost all EBITs are feeding beamlines for external experiments. More interesting is to note the diversification of these devices, which demonstrates that a matured technology is finding dedicated answers for different applications. At present we may distinguish six major lines of development and application: high current EBISs for upcoming hadron colliders, super EBITs in the energy range above 300 keV for quantum electrondynamics tests, inexpensive and small EBISTs for atomic physics studies, a highly efficient EBIS with oscillating electrons, MEDEBIS for tumor therapy with C6+, and charge breeding in facilities for exotic radioactive beams.

  17. Storage rings for radioactive ion beams

    NASA Astrophysics Data System (ADS)

    Nolden, F.; Dimopoulou, C.; Dolinskii, A.; Steck, M.

    2008-10-01

    Storage rings for radioactive heavy ions can be applied for a wide range of experiments in atomic and nuclear physics. The rare isotope beams are produced in flight via fragmentation or fission of high-intensity primary ions and they circulate in the storage ring at moderately relativistic energies (typically between 0.1 GeV/u up to 1 GeV/u). Due to their production mechanism they are usually highly charged or even fully stripped. The circulating radioactive heavy ion beams can be used to measure nuclear properties such as masses and decay times, which, in turn, can depend strongly on the ionic charge state. The storage rings must have large acceptances and dynamic apertures. The subsequent application of stochastic precooling of the secondary ions which are injected with large transverse and longitudinal emittances, and electron cooling to reach very high phase space densities has turned out to be a helpful tool for experiments with short-lived ions having lifetimes down to a few seconds. Some of these experiments have already been performed at the experimental storage ring ESR at GSI. The storage ring complex of the FAIR project is intended to enhance significantly the range of experimental possibilities. It is planned to extend the scope of experimental possibilities to collisions with electron or antiproton beams.

  18. Laser-cooled bunched ion beam

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    In collaboration with the Arhus group, the laser cooling of a beam bunched by an rf electrode was investigated at the ASTRID storage ring. A single laser is used for unidirectional cooling, since the longitudinal velocity of the beam will undergo {open_quotes}synchrotron oscillations{close_quotes} and the ions are trapped in velocity space. As the cooling proceeds the velocity spread of the beam, as well as the bunch length is measured. The bunch length decreases to the point where it is limited only by the Coulomb repulsion between ions. The measured length is slightly (20-30%) smaller than the calculated limit for a cold beam. This may be the accuracy of the measurement, or may indicate that the beam still has a large transverse temperature so that the longitudinal repulsion is less than would be expected from an absolutely cold beam. Simulations suggest that the coupling between transverse and longitudinal degrees of freedom is strong -- but this issue will have to be resolved by further measurements.

  19. MULTIPLE ELECTRON BEAM ION PUMP AND SOURCE

    DOEpatents

    Ellis, R.E.

    1962-02-27

    A vacuum pump is designed which operates by ionizing incoming air and by withdrawing the ions from the system by means of electrical fields. The apparatus comprises a cylindrical housing communicable with the vessel to be evacuated and having a thin wall section in one end. Suitable coils provide a longitudinal magnetic field within the cylinder. A broad cathode and an anode structure is provided to establish a plurality of adjacent electron beams which are parallel to the cylinder axis. Electron reflector means are provided so that each of the beams constitutes a PIG or reflex discharge. Such structure provides a large region in which incoming gas molecules may be ionized by electron bombardment. A charged electrode assembly accelerates the ions through the thin window, thereby removing the gas from the system. The invention may also be utilized as a highly efficient ion source. (AEC)

  20. Spectroscopy of ions using fast beams and ion traps

    SciTech Connect

    Pinnington, E H; Trabert, E

    2004-10-01

    A knowledge of the spectra of ionized atoms is of importance in many fields. They can be studied in a wide variety of light sources. In recent years techniques coming under the broad heatings of fast beams and ion traps have been used extensively for such investigations. This article considers the advantages that various techniques have for particular applications.

  1. Fast Ion Beam Microscopy of Whole Cells

    NASA Astrophysics Data System (ADS)

    Watt, Frank; Chen, Xiao; Chen, Ce-Belle; Udalagama, Chammika Nb; Ren, Minqin; Pastorin, G.; Bettiol, Andrew

    2013-08-01

    The way in which biological cells function is of prime importance, and the determination of such knowledge is highly dependent on probes that can extract information from within the cell. Probing deep inside the cell at high resolutions however is not easy: optical microscopy is limited by fundamental diffraction limits, electron microscopy is not able to maintain spatial resolutions inside a whole cell without slicing the cell into thin sections, and many other new and novel high resolution techniques such as atomic force microscopy (AFM) and near field scanning optical microscopy (NSOM) are essentially surface probes. In this paper we show that microscopy using fast ions has the potential to extract information from inside whole cells in a unique way. This novel fast ion probe utilises the unique characteristic of MeV ion beams, which is the ability to pass through a whole cell while maintaining high spatial resolutions. This paper first addresses the fundamental difference between several types of charged particle probes, more specifically focused beams of electrons and fast ions, as they penetrate organic material. Simulations show that whereas electrons scatter as they penetrate the sample, ions travel in a straight path and therefore maintain spatial resolutions. Also described is a preliminary experiment in which a whole cell is scanned using a low energy (45 keV) helium ion microscope, and the results compared to images obtained using a focused beam of fast (1.2 MeV) helium ions. The results demonstrate the complementarity between imaging using low energy ions, which essentially produce a high resolution image of the cell surface, and high energy ions, which produce an image of the cell interior. The characteristics of the fast ion probe appear to be ideally suited for imaging gold nanoparticles in whole cells. Using scanning transmission ion microscopy (STIM) to image the cell interior, forward scattering transmission ion microscopy (FSTIM) to improve the

  2. Ion acceleration mechanism in electron beams

    SciTech Connect

    Popov, A.F.

    1982-07-01

    Analysis of experimental data reveals that several processes observed in diodes and during the transport of intense electron beams in a neutral gas result from polarization of a plasma in an electric field. Under certain conditions this effect gives rise to a high-field region at the boundary of a plasma column. The electron beam is strongly focused in this region. As a result, a two-dimensional potential well forms at the crossover point of a strongly focused beam. The electric field at this well can reach several megavolts per centimeter. The crossover point moves as a result of expansion of the plasma cloud. The ions trapped in the potential well are accelerated. There is effective acceleration over a distance of the order of a few times the beam radius. A new physical model gives a satisfactory explanation of the experimental results.

  3. Ion-beam sputtering increases solar-cell efficiency

    NASA Technical Reports Server (NTRS)

    Burk, D. E.; Dubow, J. B.; Sites, R. R.

    1977-01-01

    Ion-beam sputtering, fabrication of oxide-semiconductor-on-silicon (OSOS) solar cells, results in cells of 12% efficiency. Ion-beam sputtering technique is compatible with low-cost continuous fabrication and requires no high-temperature processing.

  4. Silicon ion irradiation effects on the magnetic properties of ion beam synthesized CoPt phase

    SciTech Connect

    Balaji, S.; Amirthapandian, S.; Panigrahi, B. K.; Mangamma, G.; Kalavathi, S.; Gupta, Ajay; Nair, K. G. M.

    2012-06-05

    Ion beam mixing of Pt/Co bilayers using self ion (Pt{sup +}) beam results in formation of CoPt phase. Upon ion beam annealing the ion mixed samples using 4 MeV Si{sup +} ions at 300 deg. C, diffusion of Co towards the Pt/Co interface is observed. The Si{sup +} ion beam rotates the magnetization of the CoPt phase from in plane to out of plane of the film.

  5. Ion beam figuring system in NUDT

    NASA Astrophysics Data System (ADS)

    Zhou, Lin; Xie, Xuhui; Dai, Yifan; Jiao, Changjun; Li, Shengyi

    2007-12-01

    Ion beam figuring (IBF) is an optical fabrication technique that provides highly deterministic process to correct surface figure error of previously polished surfaces by using a directed, inert and neutralized ion beam to physically sputter material from the optic surface. Recently, an ion beam figuring system KDIFS-500 has been designed and built in National University of Defense Technology (NUDT) of the P.R. China. KDIFS-500 is capable of processing workpiece up to Φ500mm. Line scanning process was discussed in detail for estimating the parameters of the beam removal function (BRF) in process. Experiments were conducted to demonstrate that the BRF increases gradually in process and by employing a stability control, the BRF can be kept stable in process. Finally, a Φ95 mm plano optical sample of CVD coated SiC substrate has been figured in two process iterations for demonstrating the correction capability of the KDIFS-500. Their figure convergence ratios reached 5.8 and 2.1 respectively. The actual figure residual errors were basically consistent with the predicted error. These consistencies indicated that the IBF processes on KDIFS-500 are predictable deterministic processes.

  6. Inertial confinement fusion with light ion beams.

    PubMed

    Vandevender, J P; Cook, D L

    1986-05-16

    The Particle Beam Fusion Accelerator II (PBFA II) is presently under construction and is the only existing facility with the potential of igniting thermonuclear fuel in the laboratory. The accelerator will generate up to 5 megamperes of lithium ions at 30 million electron volts and will focus them onto an inertial confinement fusion (ICF) target after beam production and focusing have been optimized. Since its inception, the light ion approach to ICF has been considered the one that combines low cost, high risk, and high payoff. The beams are of such high density that their self-generated electric and magnetic fields were thought to prohibit high focal intensities. Recent advances in beam production and focusing demonstrate that these self-forces can be controlled to the degree required for ignition, break-even, and high gain experiments. ICF has been pursued primarily for its potential military applications. However, the high efficiency and cost-effectiveness of the light ion approach enhance its potential for commercial energy application as well. PMID:17755963

  7. High sensitivity charge amplifier for ion beam uniformity monitor

    DOEpatents

    Johnson, Gary W.

    2001-01-01

    An ion beam uniformity monitor for very low beam currents using a high-sensitivity charge amplifier with bias compensation. The ion beam monitor is used to assess the uniformity of a raster-scanned ion beam, such as used in an ion implanter, and utilizes four Faraday cups placed in the geometric corners of the target area. Current from each cup is integrated with respect to time, thus measuring accumulated dose, or charge, in Coulombs. By comparing the dose at each corner, a qualitative assessment of ion beam uniformity is made possible. With knowledge of the relative area of the Faraday cups, the ion flux and areal dose can also be obtained.

  8. Ion energy distribution near a plasma meniscus with beam extraction for multi element focused ion beams

    SciTech Connect

    Mathew, Jose V.; Paul, Samit; Bhattacharjee, Sudeep

    2010-05-15

    An earlier study of the axial ion energy distribution in the extraction region (plasma meniscus) of a compact microwave plasma ion source showed that the axial ion energy spread near the meniscus is small ({approx}5 eV) and comparable to that of a liquid metal ion source, making it a promising candidate for focused ion beam (FIB) applications [J. V. Mathew and S. Bhattacharjee, J. Appl. Phys. 105, 96101 (2009)]. In the present work we have investigated the radial ion energy distribution (IED) under the influence of beam extraction. Initially a single Einzel lens system has been used for beam extraction with potentials up to -6 kV for obtaining parallel beams. In situ measurements of IED with extraction voltages upto -5 kV indicates that beam extraction has a weak influence on the energy spread ({+-}0.5 eV) which is of significance from the point of view of FIB applications. It is found that by reducing the geometrical acceptance angle at the ion energy analyzer probe, close to unidirectional distribution can be obtained with a spread that is smaller by at least 1 eV.

  9. EDITORIAL: Negative ion based neutral beam injection

    NASA Astrophysics Data System (ADS)

    Hemsworth, R. S.

    2006-06-01

    It is widely recognized that neutral beam injection (NBI), i.e. the injection of high energy, high power, beams of H or D atoms, is a flexible and reliable system that has been the main heating system on a large variety of fusion devices, and NBI has been chosen as one of the three heating schemes of the International Tokomak Reactor (ITER). To date, all the NBI systems but two have been based on the neutralization (in a simple gas target) of positive hydrogen or deuterium ions accelerated to <100 keV/nucleon. Above that energy the neutralization of positive ions falls to unacceptably low values, and higher energy neutral beams have to be created by the neutralization of accelerated negative ions (in a simple gas target), as this remains high (approx60%) up to >1 MeV/nucleon. Unfortunately H- and D- are difficult to create, and the very characteristic that makes them attractive, the ease with which the electron is detached from the ion, means that it is difficult to create high concentrations or fluxes of them, and it is difficult to avoid substantial, collisional, losses in the extraction and acceleration processes. However, there has been impressive progress in negative ion sources and accelerators over the past decade, as demonstrated by the two pioneering, operational, multi-megawatt, negative ion based, NBI systems at LHD (180 keV, H0) and JT-60U (500 keV, D0), both in Japan. Nevertheless, the system proposed for ITER represents a substantial technological challenge as an increase is required in beam energy, to 1 MeV, D0, accelerated ion (D-) current, to 40 A, accelerated current density, 200 A m-2 of D-, and pulse length, to 1 h. At the Fourth IAEA Technical Meeting on Negative Ion Based Neutral Beam Injectors, hosted by the Consorzio RFX, Padova, Italy, 9-11 May 2005, the status of the R&D aimed at the realization of the injectors for ITER was presented. Because of the importance of this development to the success of the ITER project, participants at that

  10. Ion beam emittance from an ECRIS

    NASA Astrophysics Data System (ADS)

    Spädtke, P.; Lang, R.; Mäder, J.; Maimone, F.; Schlei, B. R.; Tinschert, K.; Biri, S.; Rácz, R.

    2016-02-01

    Simulation of ion beam extraction from an Electron Cyclotron Resonance Ion Source (ECRIS) is a fully 3 dimensional problem, even if the extraction geometry has cylindrical symmetry. Because of the strong magnetic flux density, not only the electrons are magnetized but also the Larmor radius of ions is much smaller than the geometrical dimension of the plasma chamber (Ø 64 × 179 mm). If we assume that the influence of collisions is small on the path of particles, we can do particle tracking through the plasma if the initial coordinates of particles are known. We generated starting coordinates of plasma ions by simulation of the plasma electrons, accelerated stochastically by the 14.5 GHz radio frequency power fed to the plasma. With that we were able to investigate the influence of different electron energies on the extracted beam. Using these assumptions, we can reproduce the experimental results obtained 10 years ago, where we monitored the beam profile with the help of viewing targets. Additionally, methods have been developed to investigate arbitrary 2D cuts of the 6D phase space. To this date, we are able to discuss full 4D information. Currently, we extend our analysis tool towards 5D and 6D, respectively.

  11. Ion beam sputter deposited diamond like films

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Rutledge, S. K.

    1982-01-01

    A single argon ion beam source was used to sputter deposit carbon films on fused silica, copper, and tantalum substrates under conditions of sputter deposition alone and sputter deposition combined with simultaneous argon ion bombardment. Simultaneously deposited and ion bombarded carbon films were prepared under conditions of carbon atom removal to arrival ratios of 0, 0.036, and 0.71. Deposition and etch rates were measured for films on fused silica substrates. Resulting characteristics of the deposited films are: electrical resistivity of densities of 2.1 gm/cu cm for sputter deposited films and 2.2 gm/cu cm for simultaneously sputter deposited and Ar ion bombarded films. For films approximately 1700 A thick deposited by either process and at 5550 A wavelength light the reflectance was 0.2, the absorptance was 0.7, the absorption coefficient was 67,000 cm to the -1 and the transmittance was 0.1.

  12. Ion-beam cleaning for cold welds

    NASA Technical Reports Server (NTRS)

    Slater, B. L.

    1980-01-01

    1000 eV beam bombarding metal surfaces to be joined removes oxides and contaminants at rate of several atomic layers per second for current density of 1 mA/squ. cm. Clean surfaces can then be joined by squeezing them together. With ion-beam cleaning, mating force for strong bond is low enough to cause only 1% deformation. Conventional cold-welding requires about 70% deformation for bonding. Technique was tested successfully on aluminum to aluminum welds, copper to copper, copper to aluminum, copper to nickel, and silver to iron. Base metals failed before welds in tear test.

  13. Transfer Casting From Ion-Beam-Textured Surfaces

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Sovey, J. S.

    1986-01-01

    Textured surfaces created on metals, ceramics, and polymers. Electron-bombardment ion thrustor used as neutralized-ion-beam source. Beam of directed, energetic ions alter surface chemistry and/or morphology of many materials. By adjusting ion energy and ion-beam current density impinging upon target, precise surface modifications obtained without risk of targetmaterial melting or bulk decomposition. Technique developed to generate precise, controllable, surface microstructures on metals, ceramics, and polymers.

  14. Funnel cone for focusing intense ion beams on a target

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Ni, P.

    2009-10-05

    We describe a funnel cone for concentrating an ion beam on a target. The cone utilizes the reflection characteristic of ion beams on solid walls to focus the incident beam andincrease beam intensity on target. The cone has been modeled with the TRIM code. A prototype has been tested and installed for use in the 350-keV K+ NDCX target chamber.

  15. Development of a time-of-flight mass spectrometer combined with an ion-attachment method for multicomponent gas analysis

    NASA Astrophysics Data System (ADS)

    Takaya, Kazunari; Takahashi, Karin; Deguchi, Yuri; Sakai, Yasuhiro

    2014-10-01

    We developed a new mass spectrometer that can analyse multicomponent gases without fragmentation. This is essentially a time-of-flight (TOF) mass analyser in which the ion attachment method is used for ionisation. The method using this new device is referred to as “time-of-flight analysis in combination with ion-attachment” (TOFIA). TOFIA has the capability to analyse breath gas in about 10 min using the radio-frequency (RF) ion-guiding method and a multichannel scaler (MCS). The mass resolution of the trial device was unsatisfactory, but the device can be greatly improved in the future. We successfully analysed exhaled breath gases related to diseases, including ammonia, acetone, and isoprene gases. We expect that the TOFIA device developed in this work will contribute significantly to studies on the relationship between breath gas and health.

  16. Time resolved ion beam induced charge collection

    SciTech Connect

    SEXTON,FREDERICK W.; WALSH,DAVID S.; DOYLE,BARNEY L.; DODD,PAUL E.

    2000-04-01

    Under this effort, a new method for studying the single event upset (SEU) in microelectronics has been developed and demonstrated. Called TRIBICC, for Time Resolved Ion Beam Induced Charge Collection, this technique measures the transient charge-collection waveform from a single heavy-ion strike with a {minus}.03db bandwidth of 5 GHz. Bandwidth can be expanded up to 15 GHz (with 5 ps sampling windows) by using an FFT-based off-line waveform renormalization technique developed at Sandia. The theoretical time resolution of the digitized waveform is 24 ps with data re-normalization and 70 ps without re-normalization. To preserve the high bandwidth from IC to the digitizing oscilloscope, individual test structures are assembled in custom high-frequency fixtures. A leading-edge digitized waveform is stored with the corresponding ion beam position at each point in a two-dimensional raster scan. The resulting data cube contains a spatial charge distribution map of up to 4,096 traces of charge (Q) collected as a function of time. These two dimensional traces of Q(t) can cover a period as short as 5 ns with up to 1,024 points per trace. This tool overcomes limitations observed in previous multi-shot techniques due to the displacement damage effects of multiple ion strikes that changed the signal of interest during its measurement. This system is the first demonstration of a single-ion transient measurement capability coupled with spatial mapping of fast transients.

  17. Spectrometer for cluster ion beam induced luminescence

    SciTech Connect

    Ryuto, H. Sakata, A.; Takeuchi, M.; Takaoka, G. H.; Musumeci, F.

    2015-02-15

    A spectrometer to detect the ultra-weak luminescence originated by the collision of cluster ions on the surfaces of solid materials was constructed. This spectrometer consists of 11 photomultipliers with band-pass interference filters that can detect the luminescence within the wavelength ranging from 300 to 700 nm and of a photomultiplier without filter. The calibration of the detection system was performed using the photons emitted from a strontium aluminate fluorescent tape and from a high temperature tungsten filament. Preliminary measurements show the ability of this spectrometer to detect the cluster ion beam induced luminescence.

  18. Design study of primary ion provider for relativistic heavy ion collider electron beam ion source.

    PubMed

    Kondo, K; Kanesue, T; Tamura, J; Okamura, M

    2010-02-01

    Brookhaven National Laboratory has developed the new preinjector system, electron beam ion source (EBIS) for relativistic heavy ion collider (RHIC) and National Aeronautics and Space Administration Space Radiation Laboratory. Design of primary ion provider is an essential problem since it is required to supply beams with different ion species to multiple users simultaneously. The laser ion source with a defocused laser can provide a low charge state and low emittance ion beam, and is a candidate for the primary ion source for RHIC-EBIS. We show a suitable design with appropriate drift length and solenoid, which helps to keep sufficient total charge number with longer pulse length. The whole design of primary ion source, as well as optics arrangement, solid targets configuration and heating about target, is presented. PMID:20192366

  19. Effects of Beam Filling Pattern on Beam Ion Instability and Beam Loading In PEP-X

    SciTech Connect

    Wang, L.; /SLAC

    2009-06-02

    A proposed high-brightness synchrotron light source (PEP-X) is under design at SLAC. The 4.5-GeV PEP-X storage ring has four theoretical minimum emittance (TME) cells to achieve the very low emittance and two double-bend achromat (DBA) cells to provide spaces for IDs. Damping wigglers will be installed in zero-dispersion straights to reduce the emittance below 0.1 nm. Ion induced beam instability is one critical issue due to its ultra small emittance. Third harmonic cavity can be used to lengthen the bunch in order to improve the beam's life time. Bunch-train filling pattern is proposed to mitigate both the fast ion instability and beam loading effect. This paper investigates the fast ion instability and beam loading for different beam filling patterns.

  20. Dispensing targets for ion beam particle generators

    NASA Technical Reports Server (NTRS)

    Miller, C. G. (Inventor)

    1974-01-01

    A target for dispensing high energy protons or neutrons or ionized atoms or ionized molecules is provided which comprises a container for the target gas, which is at atmospheric or higher pressure. The container material can release the target gas in the spot where the container is heated above a predetermined temperature by the impact of an ion beam where protons or neutrons are desired, or by electrons where ionized atoms or molecules are desired. On the outside of the container, except for the region where the beam is to impact, there is deposited a layer of a metal which is imperious to gaseous diffusion. A further protective coating of a material is placed over the layer of metal, except at the region of the ion impact area in order to adsorb any unreacted gas in the vacuum in which the target is placed, to thereby prevent reduction of the high vacuum, as well as contamination of the interior of the vacuum chamber.

  1. Ion-beam-assisted etching of diamond

    NASA Technical Reports Server (NTRS)

    Efremow, N. N.; Geis, M. W.; Flanders, D. C.; Lincoln, G. A.; Economou, N. P.

    1985-01-01

    The high thermal conductivity, low RF loss, and inertness of diamond make it useful in traveling wave tubes operating in excess of 500 GHz. Such use requires the controlled etching of type IIA diamond to produce grating like structures tens of micrometers deep. Previous work on reactive ion etching with O2 gave etching rates on the order of 20 nm/min and poor etch selectivity between the masking material (Ni or Cr) and the diamond. An alternative approach which uses a Xe(+) beam and a reactive gas flux of NO2 in an ion-beam-assisted etching system is reported. An etching rate of 200 nm/min was obtained with an etching rate ratio of 20 between the diamond and an aluminum mask.

  2. Simulation of ion beam injection and extraction in an EBIS

    NASA Astrophysics Data System (ADS)

    Zhao, L.; Kim, J. S.

    2016-02-01

    An example simulation of Au+ charge breeding using FAR-TECH's integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.

  3. Measurement of ultra-low ion energy of decelerated ion beam using a deflecting electric field

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Suwannakachorn, D.; Tippawan, U.; Yu, L. D.

    2015-12-01

    In investigation on ultra-low-energy ion bombardment effect on DNA, an ion beam deceleration lens was developed for high-quality ultra-low-energy ion beam. Measurement of the ion energy after deceleration was necessary to confirm the ion beam really decelerated as theoretically predicted. In contrast to conventional methods, this work used a simple deflecting electrostatic field after the deceleration lens to bend the ion beam. The beam bending distance depended on the ion energy and was described and simulated. A system for the measurement of the ion beam energy was constructed. It consisted of a pair of parallel electrode plates to generate the deflecting electrical field, a copper rod measurement piece to detect ion beam current, a vernier caliper to mark the beam position, a stepping motor to translate the measurement rod, and a webcam-camera to read the beam bending distance. The entire system was installed after the ion-beam deceleration lens inside the large chamber of the bioengineering vertical ion beam line. Moving the measurement rod across the decelerated ion beam enabled to obtain beam profiles, from which the beam bending distance could be known and the ion beam energy could be calculated. The measurement results were in good agreement with theoretical and simulated results.

  4. Beam Dynamics Considerations in Electron Ion Colliders

    NASA Astrophysics Data System (ADS)

    Krafft, Geoffrey

    2015-04-01

    The nuclear physics community is converging on the idea that the next large project after FRIB should be an electron-ion collider. Both Brookhaven National Lab and Thomas Jefferson National Accelerator Facility have developed accelerator designs, both of which need novel solutions to accelerator physics problems. In this talk we discuss some of the problems that must be solved and their solutions. Examples in novel beam optics systems, beam cooling, and beam polarization control will be presented. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. The U.S. Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce this manuscript for U.S. Government purposes.

  5. Ion beam figuring of small optical components

    NASA Astrophysics Data System (ADS)

    Drueding, Thomas W.; Fawcett, Steven C.; Wilson, Scott R.; Bifano, Thomas G.

    1995-12-01

    Ion beam figuring provides a highly deterministic method for the final precision figuring of optical components with advantages over conventional methods. The process involves bombarding a component with a stable beam of accelerated particles that selectively removes material from the surface. Figure corrections are achieved by rastering the fixed-current beam across the workplace at appropriate, time-varying velocities. Unlike conventional methods, ion figuring is a noncontact technique and thus avoids such problems as edge rolloff effects, tool wear, and force loading of the workpiece. This work is directed toward the development of the precision ion machining system at NASA's Marshall Space Flight Center. This system is designed for processing small (approximately equals 10-cm diam) optical components. Initial experiments were successful in figuring 8-cm-diam fused silica and chemical-vapor-deposited SiC samples. The experiments, procedures, and results of figuring the sample workpieces to shallow spherical, parabolic (concave and convex), and non-axially-symmetric shapes are discussed. Several difficulties and limitations encountered with the current system are discussed. The use of a 1-cm aperture for making finer corrections on optical components is also reported.

  6. Study on space charge compensation in negative hydrogen ion beam

    NASA Astrophysics Data System (ADS)

    Zhang, A. L.; Peng, S. X.; Ren, H. T.; Zhang, T.; Zhang, J. F.; Xu, Y.; Guo, Z. Y.; Chen, J. E.

    2016-02-01

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H+ beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H- beam from a 2.45 GHz microwave driven H- ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results.

  7. Study on space charge compensation in negative hydrogen ion beam.

    PubMed

    Zhang, A L; Peng, S X; Ren, H T; Zhang, T; Zhang, J F; Xu, Y; Guo, Z Y; Chen, J E

    2016-02-01

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H(+) beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H(-) beam from a 2.45 GHz microwave driven H(-) ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results. PMID:26932087

  8. Development of the Holifield Radioactive Ion Beam Facility

    SciTech Connect

    Tatum, B.A.

    1997-08-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) construction project has been completed and the first radioactive ion beam has been successfully accelerated. The project, which began in 1992, has involved numerous facility modifications. The Oak Ridge Isochronous Cyclotron has been converted from an energy booster for heavy ion beams to a light ion accelerator with internal ion source. A target-ion source and mass analysis system have been commissioned as key components of the facility`s radioactive ion beam injector to the 25MV tandem electrostatic accelerator. Beam transport lines have been completed, and new diagnostics for very low intensity beams have been developed. Work continues on a unified control system. Development of research quality radioactive beams for the nuclear structure and nuclear astrophysics communities continues. This paper details facility development to date.

  9. Radioactive Ion Beam Production Capabilities At The Holifield Radioactive Ion Beam Facility

    NASA Astrophysics Data System (ADS)

    Beene, J. R.; Dowling, D. T.; Gross, C. J.; Juras, R. C.; Liu, Y.; Meigs, M. J.; Mendez, A. J.; Nazarewicz, W.; Sinclair, J. W.; Stracener, D. W.; Tatum, B. A.

    2011-06-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) is a national user facility for research with radioactive ion beams (RIBs) that has been in routine operation since 1996. It is located at Oak Ridge National Laboratory (ORNL) and operated by the ORNL Physics Division. The principal mission of the HRIBF is the production of high quality beams of shortlived radioactive isotopes to support research in nuclear structure physics and nuclear astrophysics. HRIBF is currently unique worldwide in its ability to provide neutron-rich fission fragment beams post-accelerated to energies above the Coulomb barrier for nuclear reactions. HRIBF produces RIBs by the isotope separator on-line (ISOL) technique using a particle accelerator system that consists of the Oak Ridge Isochronous Cyclotron (ORIC) driver accelerator, one of the two Injectors for Radioactive Ion Species (IRIS1 or IRIS2) production systems, and the 25-MV tandem electrostatic accelerator that is used for RIB post-acceleration. ORIC provides a light ion beam (proton, deuteron, or alpha) which is directed onto a thick target mounted in a target-ion source (TIS) assembly located on IRIS1 or IRIS2. Radioactive atoms that diffuse from the target material are ionized, accelerated, mass selected, and transported to the tandem accelerator where they are further accelerated to energies suitable for nuclear physics research. RIBs are transported through a beam line system to various experimental end stations including the Recoil Mass Spectrometer (RMS) for nuclear structure research, and the Daresbury Recoil Separator (DRS) for nuclear astrophysics research. HRIBF also includes two off-line ion source test facilities, one low-power on-line ISOL test facility (OLTF), and one high-power on-line ISOL test facility (HPTL). This paper provides an overview and status update of HRIBF, describes the recently completed 4.7M IRIS2 addition and incorporation of laser systems for beam production and purification, and discusses a

  10. High-energy accelerator for beams of heavy ions

    DOEpatents

    Martin, Ronald L.; Arnold, Richard C.

    1978-01-01

    An apparatus for accelerating heavy ions to high energies and directing the accelerated ions at a target comprises a source of singly ionized heavy ions of an element or compound of greater than 100 atomic mass units, means for accelerating the heavy ions, a storage ring for accumulating the accelerated heavy ions and switching means for switching the heavy ions from the storage ring to strike a target substantially simultaneously from a plurality of directions. In a particular embodiment the heavy ion that is accelerated is singly ionized hydrogen iodide. After acceleration, if the beam is of molecular ions, the ions are dissociated to leave an accelerated singly ionized atomic ion in a beam. Extraction of the beam may be accomplished by stripping all the electrons from the atomic ion to switch the beam from the storage ring by bending it in magnetic field of the storage ring.

  11. Beam Ion Driven Instabilities in NSTX

    SciTech Connect

    N.N. Gorelenkov; E. Belova; H.L. Berk; C.Z. Cheng; E. Fredrickson; W. Heidbrink; S. Kaye; G. Kramer

    2003-11-07

    A low-field, low-aspect-ratio device such as NSTX (National Spherical Torus Experiment) is an excellent testbed to study the ITER-relevant physics of fast-particle confinement that is of major importance for burning plasmas. The low Alfvin speed in NSTX offers a window to the super-Alfvinic regime expected in ITER. Effects such as the large FLR, orbit width, strong shaping, and high thermal and fast-ion betas make this effort a greater challenge. We report on the linear stability of different Alfvin eigenmode (AE) branches and compare theory with experimental data. Low-frequency MHD activities, {approx}100 kHz, on NSTX are often observed and identified as the toroidicity-induced AEs (TAE) driven by beam ions. Sometimes they are accompanied by beam ion losses in H-mode, high q(0) plasmas. Numerical analysis using the NOVA-K code shows good agreement with the experimental data. The TAE instability was compared in experiments on NSTX and DIII-D. With very similar plasma conditions, we tested the theoretical prediction that the toroidal mode number of the most unstable TAEs scales with the machine minor radius, n {approx} a. In NSTX, TAEs are observed with n = 1-2, whereas in DIII-D n = 4-7. The confirmation of n scaling validates the predictive capabilities of theoretical tools (NOVA-K) for studying ITER plasmas. In the high-frequency range, recent observations of rich sub-ion cyclotron frequency MHD activities in NSTX suggest that new instabilities are excited, which we identify as Global shear AEs (GAEs). Similar to the compressional AEs (CAEs), GAEs are destabilized by the Doppler-shifted cyclotron resonance in the presence of 80 keV neutral-beam injection. To simulate GAE/CAEs in realistic NSTX plasma conditions, we have developed a nonlinear hybrid kinetic-MHD code, HYM, which is capable of computing the mode structure, saturation, and energetic particle transport.

  12. Persistent ion beam induced conductivity in zinc oxide nanowires

    SciTech Connect

    Johannes, Andreas; Niepelt, Raphael; Gnauck, Martin; Ronning, Carsten

    2011-12-19

    We report persistently increased conduction in ZnO nanowires irradiated by ion beam with various ion energies and species. This effect is shown to be related to the already known persistent photo conduction in ZnO and dubbed persistent ion beam induced conduction. Both effects show similar excitation efficiency, decay rates, and chemical sensitivity. Persistent ion beam induced conduction will potentially allow countable (i.e., single dopant) implantation in ZnO nanostructures and other materials showing persistent photo conduction.

  13. Post-acceleration of laser-induced ion beams

    NASA Astrophysics Data System (ADS)

    Nassisi, V.; Delle Side, D.

    2015-04-01

    A complete review of the essential and recent developments in the field of post-acceleration of laser-induced ion beams is presented. After a brief introduction to the physics of low-intensity nanosecond laser-matter interaction, the details of ions extraction and acceleration are critically analyzed and the key parameters to obtain good-quality ion beams are illustrated. A description of the most common ion beam diagnosis system is given, together with the associated analytical techniques.

  14. Patient position verification in ion-beam therapy using ion-beam radiography and fiducial markers

    NASA Astrophysics Data System (ADS)

    Huber, Lucas; Telsemeyer, Julia; Martišíková, Mária; Jäkel, Oliver

    2011-11-01

    The basic rationale for radiation therapy using ion-beams is its high local precision of dose deposition. Therefore accurate patient positioning prior to and during beam application is a crucial part of the therapy. The current standard position verification procedure uses X-ray based imaging before each beam application. The patient is assumed to remain in his position throughout irradiation. Currently there is no monitoring of the patient position or organ movement during treatment. The aim of this study is to investigate the possibility of verifying the position of a fiducial marker during therapy using ion radiography. Some modern ion therapy facilities like the Heidelberg Ion-Beam Therapy Center (HIT), where our measurements were carried out, use scanning pencil beams to apply dose. Exploiting them for imaging allows to solely irradiate regions of interest in the patient's body, e.g. tissue containing medical markers. The advantage of this technique is that it can be performed quickly in turn with therapeutic beam application and irradiates only very little tissue. For our measurements we used conventional medical metal markers embedded in phantom material mimicking body tissue. To image the residual beam we use a Perkin Elmer RID256-L flat panel detector. In an idealized setup the marker contrast was measured to be as high as 60%, which was reduced by a factor of 2-2.5 when the marker was placed at distances to the detector in the phantom material larger than 10 cm. It was shown that applying 2ṡ105 carbon ions suffices to make the markers' position visible in a setup of realistic material thickness and marker depth. While the dose is comparable to X-ray imaging, the irradiated volume and, consequently, also the integral dose is considerably reduced. However, in realistic geometries there are large particle range differences in lateral direction yielding steep signal gradients in the radiography. Thus, the useful image area with unambiguous signal

  15. Electron beam diagnostic for space charge measurement of an ion beam

    SciTech Connect

    Roy, Prabir K.; Yu, Simon S.; Henestroza, Enrique; Eylon, Shmuel; Shuman, Derek B.; Ludvig, Jozsef; Bieniosek, Frank M.; Waldron, William L.; Greenway, Wayne G.; Vanecek, David L.; Hannink, Ryan; Amezcua, Monserrat

    2004-09-25

    A non-perturbing electron beam diagnostic system for measuring the charge distribution of an ion beam is developed for Heavy Ion Fusion (HIF) beam physics studies. Conventional diagnostics require temporary insertion of sensors into the beam, but such diagnostics stop the beam, or significantly alter its properties. In this diagnostic a low energy, low current electron beam is swept transversely across the ion beam; the measured electron beam deflection is used to infer the charge density profile of the ion beam. The initial application of this diagnostic is to the Neutralized Transport Experiment (NTX), which is exploring the physics of space-charge-dominated beam focusing onto a small spot using a neutralizing plasma. Design and development of this diagnostic and performance with the NTX ion beamline is presented.

  16. Nanotubular structured Si-based multicomponent anodes for high-performance lithium-ion batteries with controllable pore size via coaxial electro-spinning.

    PubMed

    Ryu, Jaegeon; Choi, Sinho; Bok, Taesoo; Park, Soojin

    2015-04-14

    We demonstrate a simple but straightforward process for the synthesis of nanotube-type Si-based multicomponents by combining a coaxial electrospinning technique and subsequent metallothermic reduction reaction. Si-based multicomponent anodes consisting of Si, alumina and titanium silicide show several advantages for high-performance lithium-ion batteries. Alumina and titanium silicide, which have high mechanical properties, act as an effective buffer layer for the large volume change of Si, resulting in outstanding volume suppression behavior (volume expansion of only 14%). Moreover, electrically conductive titanium silicide layers located at the inner and outer layers of a Si nanotube exhibit a high initial coulombic efficiency of 88.5% and an extraordinary rate capability. Nanotubular structured Si-based multicomponents with mechanically and electrically improved components can be used as a promising alternative to conventional graphite anode materials. This synthetic route can be extended to other high capacity lithium-ion battery anode materials. PMID:25772327

  17. Ion beams as a means of deposition and in-situ characterization of thin films and thin film layered structures

    SciTech Connect

    Krauss, A.R.; Rangaswamy, M.; Gruen, D.M. ); Lin, Y.P. Northwestern Univ., Evanston, IL . Dept. of Materials Science); Schultz, J.A. ); Schmidt, H. ); Liu, Y.L. (Argonne National Lab., IL (United States

    1992-01-01

    Ion beam-surface interactions produce many effects in thin film deposition which are similar to those encountered in plasma deposition processes. However, because of the lower pressures and higher directionality associated with the ion beam process, it is easier to avoid some sources of film contamination and to provide better control of ion energies and fluxes. Additional effects occur in the ion beam process because of the relatively small degree of thermalization resulting from gas phase collisions with both the ion beam and atoms sputtered from the target. These effects may be either beneficial or detrimental to the film properties, depending on the material and deposition conditions. Ion beam deposition is particularly suited to the deposition of multi-component films and layered structures, and can in principle be extended to a complete device fabrication process. However, complex phenomena occur in the deposition of many materials of high technical interest which make it desirable to monitor the film growth at the monolayer level. It is possible to make use of ion-surface interactions to provide a full suite of surface analytical capabilities in one instrument, and this data may be obtained at ambient pressures which are far too high for conventional surface analysis techniques. Such an instrument is under development and its current performance characteristics and anticipated capabilities are described.

  18. Ion beams as a means of deposition and in-situ characterization of thin films and thin film layered structures

    SciTech Connect

    Krauss, A.R.; Rangaswamy, M.; Gruen, D.M.; Lin, Y.P.; Schultz, J.A.; Schmidt, H.; Liu, Y.L.; Auciello, O.; Barr, T.; Chang, R.P.H.

    1992-08-01

    Ion beam-surface interactions produce many effects in thin film deposition which are similar to those encountered in plasma deposition processes. However, because of the lower pressures and higher directionality associated with the ion beam process, it is easier to avoid some sources of film contamination and to provide better control of ion energies and fluxes. Additional effects occur in the ion beam process because of the relatively small degree of thermalization resulting from gas phase collisions with both the ion beam and atoms sputtered from the target. These effects may be either beneficial or detrimental to the film properties, depending on the material and deposition conditions. Ion beam deposition is particularly suited to the deposition of multi-component films and layered structures, and can in principle be extended to a complete device fabrication process. However, complex phenomena occur in the deposition of many materials of high technical interest which make it desirable to monitor the film growth at the monolayer level. It is possible to make use of ion-surface interactions to provide a full suite of surface analytical capabilities in one instrument, and this data may be obtained at ambient pressures which are far too high for conventional surface analysis techniques. Such an instrument is under development and its current performance characteristics and anticipated capabilities are described.

  19. Development of broad beam ion sources at CSSAR

    NASA Astrophysics Data System (ADS)

    Feng, Y. C.; You, D. W.; Kuang, Y. Z.

    1994-04-01

    High-energy and intense beam current broad beam ion sources have been developed for ion implantation and dynamic recoil mixing at CSSAR. The sources can be operated over beam energy and current ranges of 3-120 keV and 5-70 mA, respectively. For sputter coating of thin films, a series of focusing beam ion sources with different structures has also been developed. The energy and current range from 1-10 keV and 100-350 mA for different applications. For some applications, low-energy (below 100 eV) ion beams are required. CSSAR has developed a 6-cm-diam broad beam ion source. The source can be operated at beam energy 10-70 eV, and the beam current 15-80 mA has been extracted. Typical structures and operational data are given for the sources mentioned above. Recently a new type of broad beam metal ion source (Electron Beam Evaporation Metal Ion Source EBE) is being studied. Ion beams of several kinds of materials such as C, W, Ta, Mo, Cr, Ti, B, Cu, etc. have been extracted from the source. Typical operation conditions and ion yields are given in this paper.

  20. Radially uniform circular sweep of ion beam

    SciTech Connect

    Akhmetov, T.D.; Davydenko, V.I.; Ivanov, A.A.; Kobets, V.V.; Medvedko, A.S.; Skorobogatov, D.N.; Tiunov, M.A.

    2006-03-15

    A spiral sweep of the ion beam was suggested to provide sufficiently uniform irradiation of a circular target. It is shown that if the beam radius is small enough, the radius of the beam center should increase as a square root of time to provide uniform radial irradiation of the target. In the complex for Boron Neutron Capture Therapy developed at the Budker Institute of Nuclear Physics, the proton beam sweep will be performed by a sweeper with uniform magnetic field with strength up to 500 G and axial length {approx}20 cm, rotating at 100-2000 Hz, and scanning over the radius at a 1-10 Hz frequency. The sweeper field is produced by four longitudinal flat current windings placed near the inner walls of a box-shaped yoke with the inner opening of a square cross section. A similar sweeping technique can be used in a 200 keV oxygen implanter, which is also under development at the Budker Institute.

  1. Nanotubular structured Si-based multicomponent anodes for high-performance lithium-ion batteries with controllable pore size via coaxial electro-spinning

    NASA Astrophysics Data System (ADS)

    Ryu, Jaegeon; Choi, Sinho; Bok, Taesoo; Park, Soojin

    2015-03-01

    We demonstrate a simple but straightforward process for the synthesis of nanotube-type Si-based multicomponents by combining a coaxial electrospinning technique and subsequent metallothermic reduction reaction. Si-based multicomponent anodes consisting of Si, alumina and titanium silicide show several advantages for high-performance lithium-ion batteries. Alumina and titanium silicide, which have high mechanical properties, act as an effective buffer layer for the large volume change of Si, resulting in outstanding volume suppression behavior (volume expansion of only 14%). Moreover, electrically conductive titanium silicide layers located at the inner and outer layers of a Si nanotube exhibit a high initial coulombic efficiency of 88.5% and an extraordinary rate capability. Nanotubular structured Si-based multicomponents with mechanically and electrically improved components can be used as a promising alternative to conventional graphite anode materials. This synthetic route can be extended to other high capacity lithium-ion battery anode materials.We demonstrate a simple but straightforward process for the synthesis of nanotube-type Si-based multicomponents by combining a coaxial electrospinning technique and subsequent metallothermic reduction reaction. Si-based multicomponent anodes consisting of Si, alumina and titanium silicide show several advantages for high-performance lithium-ion batteries. Alumina and titanium silicide, which have high mechanical properties, act as an effective buffer layer for the large volume change of Si, resulting in outstanding volume suppression behavior (volume expansion of only 14%). Moreover, electrically conductive titanium silicide layers located at the inner and outer layers of a Si nanotube exhibit a high initial coulombic efficiency of 88.5% and an extraordinary rate capability. Nanotubular structured Si-based multicomponents with mechanically and electrically improved components can be used as a promising alternative to

  2. The Neutralization of Ion-Rocket Beams

    NASA Technical Reports Server (NTRS)

    Kaufman, Harold R.

    1961-01-01

    The experimental ion-beam behavior obtained without neutralizers is compared with both simple collision theory and plasma-wave theory. This comparison indicates that plasma waves play an important part in beam behavior, although the present state of plasma-wave theory does not permit more than a qualitative comparison. The theories of immersed-emitter and electron-trap neutralizer operation are discussed; and, to the extent permitted by experimental data, the theory is compared with experimental results. Experimental data are lacking completely at the present time for operation in space. The results that might be expected in space and the means of simulating such operation in Earth-bound facilities, however, are discussed.

  3. Modeling of a multicharged ion beam line using SIMION

    NASA Astrophysics Data System (ADS)

    Korwin-Pawlowski, Michael L.; Amiz, Karima; Elsayed-Ali, Hani

    2009-06-01

    Multicharged ion beams (MCI) are promising tools to probe or modify the surface of materials with applications in microelectronics and nanotechnology. Ion beam lines are parts of the MCI systems connecting the ion source with the processing chamber and they perform the function of extracting, accelerating, decelerating, focusing and scanning the ion beam on the surface of the target. In our work we present results of modeling of an MCI beam line using the SIMION code to simulate the flight of ions, with the purpose of optimizing the yield of the line and avoiding spurious effects due to interaction of the ions with the metallic elements of the line, such as heating, outgassing and excessive Xray emission. We show that a two stage ion extractor could significantly reduce ion beam losses.

  4. University of Wisconsin Ion Beam Laboratory: A facility for irradiated materials and ion beam analysis

    SciTech Connect

    Field, K. G.; Wetteland, C. J.; Cao, G.; Maier, B. R.; Gerczak, T. J.; Kriewaldt, K.; Sridharan, K.; Allen, T. R.; Dickerson, C.; Field, C. R.

    2013-04-19

    The University of Wisconsin Ion Beam Laboratory (UW-IBL) has recently undergone significant infrastructure upgrades to facilitate graduate level research in irradiated materials phenomena and ion beam analysis. A National Electrostatics Corp. (NEC) Torodial Volume Ion Source (TORVIS), the keystone upgrade for the facility, can produce currents of hydrogen ions and helium ions up to {approx}200 {mu}A and {approx}5 {mu}A, respectively. Recent upgrades also include RBS analysis packages, end station developments for irradiation of relevant material systems, and the development of an in-house touch screen based graphical user interface for ion beam monitoring. Key research facilitated by these upgrades includes irradiation of nuclear fuels, studies of interfacial phenomena under irradiation, and clustering dynamics of irradiated oxide dispersion strengthened steels. The UW-IBL has also partnered with the Advanced Test Reactor National Scientific User Facility (ATR-NSUF) to provide access to the irradiation facilities housed at the UW-IBL as well as access to post irradiation facilities housed at the UW Characterization Laboratory for Irradiated Materials (CLIM) and other ATR-NSUF partner facilities. Partnering allows for rapid turnaround from proposed research to finalized results through the ATR-NSUF rapid turnaround proposal system. An overview of the UW-IBL including CLIM and relevant research is summarized.

  5. Development of a focused ion beam micromachining system

    SciTech Connect

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  6. Focused ion beam in dental research.

    PubMed

    Ngo, H; Cairney, J; Munroe, P; Vargas, M; Mount, G

    2000-11-01

    Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been confined to the semiconductor industry. It has been developed as an important tool in defect analysis, circuit modification and recently transmission electron microscope sample preparation. This paper introduces FIB and demonstrates its application in dental research. Its ion and electron imaging modes complement the SEM while its ability to prepare TEM samples from a wide range of material will allow the study of new types of adhesive interface. As an example, its use is described in the characterization of the interface of resin to a tribochemically treated surface of an experimental fiber-reinforced resin-based composite. As with all new techniques, the initial learning curve was difficult to manage. This new instrument offers opportunities to expand research in dental materials to areas not possible before. PMID:11763915

  7. Enantiomer-specific analysis of multi-component mixtures by correlated electron imaging-ion mass spectrometry.

    PubMed

    Fanood, Mohammad M Rafiee; Ram, N Bhargava; Lehmann, C Stefan; Powis, Ivan; Janssen, Maurice H M

    2015-01-01

    Simultaneous, enantiomer-specific identification of chiral molecules in multi-component mixtures is extremely challenging. Many established techniques for single-component analysis fail to provide selectivity in multi-component mixtures and lack sensitivity for dilute samples. Here we show how enantiomers may be differentiated by mass-selected photoelectron circular dichroism using an electron-ion coincidence imaging spectrometer. As proof of concept, vapours containing ∼1% of two chiral monoterpene molecules, limonene and camphor, are irradiated by a circularly polarized femtosecond laser, resulting in multiphoton near-threshold ionization with little molecular fragmentation. Large chiral asymmetries (2-4%) are observed in the mass-tagged photoelectron angular distributions. These asymmetries switch sign according to the handedness (R- or S-) of the enantiomer in the mixture and scale with enantiomeric excess of a component. The results demonstrate that mass spectrometric identification of mixtures of chiral molecules and quantitative determination of enantiomeric excess can be achieved in a table-top instrument. PMID:26104140

  8. Enantiomer-specific analysis of multi-component mixtures by correlated electron imaging-ion mass spectrometry

    NASA Astrophysics Data System (ADS)

    Fanood, Mohammad M. Rafiee; Ram, N. Bhargava; Lehmann, C. Stefan; Powis, Ivan; Janssen, Maurice H. M.

    2015-06-01

    Simultaneous, enantiomer-specific identification of chiral molecules in multi-component mixtures is extremely challenging. Many established techniques for single-component analysis fail to provide selectivity in multi-component mixtures and lack sensitivity for dilute samples. Here we show how enantiomers may be differentiated by mass-selected photoelectron circular dichroism using an electron-ion coincidence imaging spectrometer. As proof of concept, vapours containing ~1% of two chiral monoterpene molecules, limonene and camphor, are irradiated by a circularly polarized femtosecond laser, resulting in multiphoton near-threshold ionization with little molecular fragmentation. Large chiral asymmetries (2-4%) are observed in the mass-tagged photoelectron angular distributions. These asymmetries switch sign according to the handedness (R- or S-) of the enantiomer in the mixture and scale with enantiomeric excess of a component. The results demonstrate that mass spectrometric identification of mixtures of chiral molecules and quantitative determination of enantiomeric excess can be achieved in a table-top instrument.

  9. Enantiomer-specific analysis of multi-component mixtures by correlated electron imaging–ion mass spectrometry

    PubMed Central

    Fanood, Mohammad M Rafiee; Ram, N. Bhargava; Lehmann, C. Stefan; Powis, Ivan; Janssen, Maurice H. M.

    2015-01-01

    Simultaneous, enantiomer-specific identification of chiral molecules in multi-component mixtures is extremely challenging. Many established techniques for single-component analysis fail to provide selectivity in multi-component mixtures and lack sensitivity for dilute samples. Here we show how enantiomers may be differentiated by mass-selected photoelectron circular dichroism using an electron–ion coincidence imaging spectrometer. As proof of concept, vapours containing ∼1% of two chiral monoterpene molecules, limonene and camphor, are irradiated by a circularly polarized femtosecond laser, resulting in multiphoton near-threshold ionization with little molecular fragmentation. Large chiral asymmetries (2–4%) are observed in the mass-tagged photoelectron angular distributions. These asymmetries switch sign according to the handedness (R- or S-) of the enantiomer in the mixture and scale with enantiomeric excess of a component. The results demonstrate that mass spectrometric identification of mixtures of chiral molecules and quantitative determination of enantiomeric excess can be achieved in a table-top instrument. PMID:26104140

  10. Analysis of multicomponent evaporation in electron beam melting and refining of titanium alloys

    SciTech Connect

    Powell, A.; Szekely, J.; Pal, U.; Avyle, J. van den; Damkroger, B.

    1997-12-01

    Experimental evidence and a mathematical model are presented to evaluate the effect of beam-scan frequency on composition change in electron-beam melting of titanium alloys. Experiments characterized the evaporation rate of commercially pure (CP) titanium and vapor composition over titanium alloy with up to 6 wt pct aluminum and 4.5 wt pct vanadium, as a function of beam power, scan frequency, and background pressure. These data and thermal mapping of the hearth melt surface are used to estimate activity coefficients of aluminum and vanadium in the hearth. The model describes transient heat transfer in the surface of the melt and provides a means of estimating enhancement of pure titanium evaporation and change in final aluminum composition due to local heating at moderate beam-scan frequencies.

  11. Positive and negative ion beam merging system for neutral beam production

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani

    2005-12-13

    The positive and negative ion beam merging system extracts positive and negative ions of the same species and of the same energy from two separate ion sources. The positive and negative ions from both sources pass through a bending magnetic field region between the pole faces of an electromagnet. Since the positive and negative ions come from mirror image positions on opposite sides of a beam axis, and the positive and negative ions are identical, the trajectories will be symmetrical and the positive and negative ion beams will merge into a single neutral beam as they leave the pole face of the electromagnet. The ion sources are preferably multicusp plasma ion sources. The ion sources may include a multi-aperture extraction system for increasing ion current from the sources.

  12. Neutral Beam Ion Loss Modelling for NSTX

    NASA Astrophysics Data System (ADS)

    Darrow, D. S.; Akers, R.; Kaye, S. M.; Mikkelsen, D. R.

    1999-11-01

    The loss of 80 keV D neutral beam ions to the walls has been modeled for a range of plasma conditions in NSTX using the EIGOL code[1]. Initial results of the code are in reasonable agreement with those from the LOCUST code[2]. Both codes predict loss fractions of 20% for a discharge with β_T=40% and q_0=2.6. Losses are strongly concentrated on the front face and edges of the high-harmonic fast wave antenna as it projects farther inward than other internal structures at the midplane. The edges of the passive stabilizer plates near the midplane are also subject to a large flux of lost beam ions under some conditions. The dependence of the loss upon the plasma density profile, I_p, and BT will be presented. [1] D. S. Darrow, et al., in Proceedings of the 26th EPS Conference on Controlled Fusion and Plasma Physics, Maastricht, The Netherlands, 14-18 June 1999. [2] R. Akers, et al., ibid.

  13. Ion beam probing of electrostatic fields

    NASA Technical Reports Server (NTRS)

    Persson, H.

    1979-01-01

    The determination of a cylindrically symmetric, time-independent electrostatic potential V in a magnetic field B with the same symmetry by measurements of the deflection of a primary beam of ions is analyzed and substantiated by examples. Special attention is given to the requirements on canonical angular momentum and total energy set by an arbitrary, nonmonotone V, to scaling laws obtained by normalization, and to the analogy with ionospheric sounding. The inversion procedure with the Abel analysis of an equivalent problem with a one-dimensional fictitious potential is used in a numerical experiment with application to the NASA Lewis Modified Penning Discharge. The determination of V from a study of secondary beams of ions with increased charge produced by hot plasma electrons is also analyzed, both from a general point of view and with application to the NASA Lewis SUMMA experiment. Simple formulas and geometrical constructions are given for the minimum energy necessary to reach the axis, the whole plasma, and any point in the magnetic field. The common, simplifying assumption that V is a small perturbation is critically and constructively analyzed; an iteration scheme for successively correcting the orbits and points of ionization for the electrostatic potential is suggested.

  14. Materials processing with intense pulsed ion beams

    SciTech Connect

    Rej, D.J.; Davis, H.A.; Olson, J.C.

    1996-12-31

    We review research investigating the application of intense pulsed ion beams (IPIBs) for the surface treatment and coating of materials. The short range (0.1-10 {mu}m) and high-energy density (1-50 J/cm{sup 2}) of these short-pulsed ({le} 1 {mu}s) beams (with ion currents I = 5 - 50 kA, and energies E = 100 - 1000 keV) make them ideal to flash-heat a target surface, similar to the more familiar pulsed laser processes. IPIB surface treatment induces rapid melt and solidification at up to 10{sup 10} K/s to cause amorphous layer formation and the production of non-equilibrium microstructures. At higher energy density the target surface is vaporized, and the ablated vapor is condensed as coatings onto adjacent substrates or as nanophase powders. Progress towards the development of robust, high-repetition rate IPIB accelerators is presented along with economic estimates for the cost of ownership of this technology.

  15. Ion beam requirements for fast ignition of inertial fusion targets

    SciTech Connect

    Honrubia, J. J.; Murakami, M.

    2015-01-15

    Ion beam requirements for fast ignition are investigated by numerical simulation taking into account new effects, such as ion beam divergence, not included before. We assume that ions are generated by the TNSA scheme in a curved foil placed inside a re-entrant cone and focused on the cone apex or beyond. From the focusing point to the compressed core, ions propagate with a given divergence angle. Ignition energies are obtained for two compressed fuel configurations heated by proton and carbon ion beams. The dependence of the ignition energies on the beam divergence angle and on the position of the ion beam focusing point has been analyzed. Comparison between TNSA and quasi-monoenergetic ions is also shown.

  16. The prospects of a subnanometer focused neon ion beam.

    PubMed

    Rahman, F H M; McVey, Shawn; Farkas, Louis; Notte, John A; Tan, Shida; Livengood, Richard H

    2012-01-01

    The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress. PMID:21796647

  17. Performance and Controllability of Pulsed Ion Beam Ablation Propulsion

    SciTech Connect

    Yazawa, Masaru; Buttapeng, Chainarong; Harada, Nobuhiro; Suematsu, Hisayuki; Jiang Weihua; Yatsui, Kiyoshi

    2006-05-02

    We propose novel propulsion driven by ablation plasma pressures produced by the irradiation of pulsed ion beams onto a propellant. The ion beam ablation propulsion demonstrates by a thin foil (50 {mu}mt), and the flyer velocity of 7.7 km/s at the ion beam energy density of 2 kJ/cm2 adopted by using the Time-of-flight method is observed numerically and experimentally. We estimate the performance of the ion beam ablation propulsion as specific impulse of 3600 s and impulse bit density of 1700 Ns/m2 obtained from the demonstration results. In the numerical analysis, a one-dimensional hydrodynamic model with ion beam energy depositions is used. The control of the ion beam kinetic energy is only improvement of the performance but also propellant consumption. The spacecraft driven by the ion beam ablation provides high performance efficiency with short-pulsed ion beam irradiation. The numerical results of the advanced model explained latent heat and real gas equation of state agreed well with experimental ones over a wide range of the incident ion beam energy density.

  18. Ion Beam Energy Dependant Study of Nanopore Sculpting

    NASA Astrophysics Data System (ADS)

    Ledden, Brad

    2005-03-01

    Experiments show that ion beams of various energies (1keV, 3keV, and 5keV) can be used to controllably ``sculpt'' nanoscale features in silicon nitride films using a feedback controlled ion beam sculpting apparatus. We report on nanopore ion beam sculpting effects that depend on inert gas ion beam energy. We show that: (1) all ion beam energies enable single nanometer control of structural dimensions in nanopores; (2) the ion beam energies above show similar ion beam flux dependence of nanopore formation; (3) the thickness of nanopores differs depending on ion beam energy. Computer simulations (with SRIM and TRIM) and an ``adatom'' surface diffusion model are employed to explain the dynamics of nanoscale dimension change by competing sputtering and surface mass transport processes induced by different ion beam irradiation. These experiments and theoretical work reveal the surface atomic transport phenomena in a quantitative way that allows the extraction of parameters such as the adatom surface diffusion coefficients and average travel distances.

  19. Spacecraft charging during ion beam emissions in sunlight

    NASA Technical Reports Server (NTRS)

    Lai, S. T.; Mcneil, W. J.; Aggson, T. L.

    1990-01-01

    During ion beam emissions from the SCATHA satellite, the potential of the negatively charged satellite body shows a sinusoidal oscillation frequency of once-per-spin of the satellite. The minimum occurs when the ion beam is sunward. The processes that may be responsible for the voltage modulation are considered. Neutralization of ion beam space charge by photoelectrons is examined. The photoelectrons are accelerated by the negative potential of the satellite. Effects of electron impact ionization, excitation of metastable states, and photoionization of xenon neutral atoms in the ion beam are studied in detail. Critical ionization velocity interaction is unlikely under the condition considered.

  20. DEVELOPMENT OF EMITTANCE ANALYSIS SOFTWARE FOR ION BEAM CHARACTERIZATION

    SciTech Connect

    Padilla, M. J.; Liu, Y.

    2007-01-01

    Transverse beam emittance is a crucial property of charged particle beams that describes their angular and spatial spread. It is a fi gure of merit frequently used to determine the quality of ion beams, the compatibility of an ion beam with a given beam transport system, and the ability to suppress neighboring isotopes at on-line mass separator facilities. Generally a high quality beam is characterized by a small emittance. In order to determine and improve the quality of ion beams used at the Holifi eld Radioactive Ion beam Facility (HRIBF) for nuclear physics and nuclear astrophysics research, the emittances of the ion beams are measured at the off-line Ion Source Test Facilities. In this project, emittance analysis software was developed to perform various data processing tasks for noise reduction, to evaluate root-mean-square emittance, Twiss parameters, and area emittance of different beam fractions. The software also provides 2D and 3D graphical views of the emittance data, beam profi les, emittance contours, and RMS. Noise exclusion is essential for accurate determination of beam emittance values. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is employed. Numerical data analysis techniques such as interpolation and nonlinear fi tting are also incorporated into the software. The software will provide a simplifi ed, fast tool for comprehensive emittance analysis. The main functions of the software package have been completed. In preliminary tests with experimental emittance data, the analysis results using the software were shown to be accurate.

  1. Microdosimetry in ion-beam therapy

    NASA Astrophysics Data System (ADS)

    Magrin, Giulio; Mayer, Ramona

    2015-05-01

    The information of the dose is not sufficiently describing the biological effects of ions on tissue since it does not express the radiation quality, i.e. the heterogeneity of the processes due to the slowing-down and the fragmentation of the particles when crossing a target. Depending on different circumstances, the radiation quality can be determined using measurements, calculations, or simulations. Microdosimeters are the primary tools used to provide the experimental information of the radiation quality and their role is becoming crucial for the recent clinical developments in particular with carbon ion therapy. Microdosimetry is strongly linked to the biological effectiveness of the radiation since it provides the physical parameters which explicitly distinguish the radiation for its capability of damaging cells. In the framework of ion-beam therapy microdosimetry can be used in the preparation of the treatment to complement radiobiological experiments and to analyze the modification of the radiation quality in phantoms. A more ambitious goal is to perform the measurements during the irradiation procedure to determine the non-targeted radiation and, more importantly, to monitor the modification of the radiation quality inside the patient. These procedures provide the feedback of the treatment directly beneficial for the single patient but also for the characterization of the biological effectiveness in general with advantages for all future treatment. Traditional and innovative tools are currently under study and an outlook of present experience and future development is presented here.

  2. Testing Time Dilation on Fast Ion Beams

    NASA Astrophysics Data System (ADS)

    Saathoff, G.; Reinhardt, S.; Bernhardt, B.; Holzwarth, R.; Udem, T.; Hänsch, T. W.; Bing, D.; Schwalm, D.; Wolf, A.; Botermann, B.; Karpuk, S.; Novotny, C.; Nörtershäuser, W.; Huber, G.; Geppert, C.; Kühl, T.; Stöhlker, T.; Rempel, T.; Gwinner, G.

    2011-12-01

    We report the status of an experimental test of special-relativistic time dilation. Following an idea of Ives and Stilwell in 1938, we measure the forward and backward Doppler shifts of an electronic transition of fast moving ions, using high-precision laser spectroscopy. From these Doppler shifts both the ion velocity β = υ/c and the time dilation factor γ = γ {SR} (1 + hat α β 2 ) can be derived for testing Special Relativity. From measurements based on saturation spectroscopy on lithium ions stored at β = 0.03 and β = 0.06, we achieved an upper limit for deviation from Special Relativity of <=ft| {hat α } ; | \\underline < 8 × 10{ - 8} . Recent measurements on a β = 0.338 Li+ beam show similar sensitivity and promise an improvement by at least one order of magnitude. Finally we discuss present sensitivities to various coefficients in the photon and particle sector of the Standard-Model Extension, as well as possible modifications of the experiment for the test of further, hitherto unbounded, coefficients.

  3. A new luminescence beam profile monitor for intense proton and heavy ion beams

    SciTech Connect

    Tsang,T.; Bellavia, S.; Connolly, R.; Gassner, D.; Makdisi, Y.; Russo, T.; Thieberger, P.; Trbojevic, D.; Zelenski, A.

    2008-10-01

    A new luminescence beam profile monitor is realized in the polarized hydrogen gas jet target at the Relativistic Heavy Ion Collider (RHIC) facility. In addition to the spin polarization of the proton beam being routinely measured by the hydrogen gas jet, the luminescence produced by beam-hydrogen excitation leads to a strong Balmer series lines emission. A selected hydrogen Balmer line is spectrally filtered and imaged to produce the transverse RHIC proton beam shape with unprecedented details on the RHIC beam profile. Alternatively, when the passage of the high energy RHIC gold ion beam excited only the residual gas molecules in the beam path, sufficient ion beam induced luminescence is produced and the transverse gold ion beam profile is obtained. The measured transverse beam sizes and the calculated emittances provide an independent confirmation of the RHIC beam characteristics and to verify the emittance conservation along the RHIC accelerator. This optical beam diagnostic technique by making use of the beam induced fluorescence from injected or residual gas offers a truly noninvasive particle beam characterization, and provides a visual observation of proton and heavy ion beams. Combined with a longitudinal bunch measurement system, a 3-dimensional spatial particle beam profile can be reconstructed tomographically.

  4. Dispersion relation of electrostatic ion cyclotron waves in multi-component magneto-plasma

    SciTech Connect

    Khaira, Vibhooti Ahirwar, G.

    2015-07-31

    Electrostatic ion cyclotron waves in multi component plasma composed of electrons (denoted by e{sup −}), hydrogen ions (denoted by H{sup +}), helium ions (denoted by He{sup +}) and positively charged oxygen ions (denoted by O{sup +})in magnetized cold plasma. The wave is assumed to propagate perpendicular to the static magnetic field. It is found that the addition of heavy ions in the plasma dispersion modified the lower hybrid mode and also allowed an ion-ion mode. The frequencies of the lower hybrid and ion- ion hybrid modes are derived using cold plasma theory. It is observed that the effect of multi-ionfor different plasma densities on electrostatic ion cyclotron waves is to enhance the wave frequencies. The results are interpreted for the magnetosphere has been applied parameters by auroral acceleration region.

  5. Simulation of multicomponent losses in electron beam melting and refining at varying scan frequencies

    SciTech Connect

    Powell, A.; Szekely, J.; Van Den Avyle, J.; Damkroger, B.

    1995-10-12

    A two-stage model is presented to describe alloy element evaporation rates from molten metal due to transient local heating by an electron beam. The first stage is a simulation of transient phenomena near the melt surface due to periodic heating by a scanning beam, the output of which is the relationship between operating parameters, surface temperature, and evaporation rate. At high scan rates, this can be done using a simple one-dimensional heat transfer model of the surface layer; at lower scan rates, a more complex three-dimensional model with fluid flow and periodic boundary conditions is necessary. The second stage couples this evaporation-surface temperature relationship with a larger steady state heat transfer and fluid flow model of an entire melting hearth or mold, in order to calculate local and total evaporation rates. Predictions are compared with experimental results from Sandia`s 310-kW electron beam melting furnace, in which evaporation rates and vapor compositions were studied in pure titanium and Ti-6%Al-4%V alloy. Evaporation rates were estimated from rate of condensation on a substrate held over the hearth, and were characterized as a function of beam power (150 and 225 kW), scan frequency (30, 115 and 450 Hz) and background pressure (10{sup {minus}3}, 10{sup {minus}4} and 10{sup {minus}5} torr).

  6. Simulation of multicomponent losses in electron beam melting and refining at varying scan frequencies

    SciTech Connect

    Powell, A.; Szekely, J.; Avyle, J.V.D.; Damkroger, B.

    1995-12-31

    A two-stage model is presented to describe alloy element evaporation rates from molten metal due to transient local heating by an electron beam. The first stage is a simulation of transient phenomena near the melt surface due to periodic heating by a scanning beam, the output of which is the relationship between operating parameters, surface temperature, and evaporation rate. At high scan rates, this can be done using a simple one-dimensional heat transfer model of the surface layer; at lower scan rates, a more complex three-dimensional model with fluid flow and periodic boundary conditions is necessary. The second stage couples this evaporation-surface temperature relationship with a larger steady state heat transfer and fluid flow model of an entire melting hearth or mold, in order to calculate local and total evaporation rates. Predictions are compared with experimental results from Sandia`s 310-kW electron beam melting furnace, in which evaporation rates and vapor compositions were studied in pure titanium and Ti-6%Al-4%V alloy. Evaporation rates were estimated from rate of condensation on a substrate held over the hearth, and were characterized as a function of beam power (10{sup {minus}3}, 10{sup {minus}4} and 10{sup {minus}5} torr).

  7. Laser cooling of relativistic heavy-ion beams for FAIR

    NASA Astrophysics Data System (ADS)

    Winters, D.; Beck, T.; Birkl, G.; Dimopoulou, C.; Hannen, V.; Kühl, Th; Lochmann, M.; Loeser, M.; Ma, X.; Nolden, F.; Nörtershäuser, W.; Rein, B.; Sánchez, R.; Schramm, U.; Siebold, M.; Spiller, P.; Steck, M.; Stöhlker, Th; Ullmann, J.; Walther, Th; Wen, W.; Yang, J.; Zhang, D.; Bussmann, M.

    2015-11-01

    Laser cooling is a powerful technique to reduce the longitudinal momentum spread of stored relativistic ion beams. Based on successful experiments at the experimental storage ring at GSI in Darmstadt, of which we show some important results in this paper, we present our plans for laser cooling of relativistic ion beams in the future heavy-ion synchrotron SIS100 at the Facility for Antiproton and Ion Research in Darmstadt.

  8. ITEP MEVVA ion beam for rhenium silicide production

    SciTech Connect

    Kulevoy, T.; Seleznev, D.; Kropachev, G.; Kozlov, A.; Kuibeda, R.; Yakushin, P.; Petrenko, S.; Gerasimenko, N.; Medetov, N.; Zaporozhan, O.

    2010-02-15

    The rhenium silicides are very attractive materials for semiconductor industry. In the Institute for Theoretical and Experimental Physics (ITEP) at the ion source test bench the research program of rhenium silicide production by ion beam implantation are going on. The investigation of silicon wafer after implantation of rhenium ion beam with different energy and with different total dose were carried out by secondary ions mass spectrometry, energy-dispersive x-ray microanalysis, and x-ray diffraction analysis. The first promising results of rhenium silicide film production by high intensity ion beam implantation are presented.

  9. New method of beam bunching in free-ion lasers

    SciTech Connect

    Bessonov, E.G.

    1995-12-31

    An effective ion beam bunching method is suggested. This method is based on a selective interaction of line spectrum laser light (e.g. axial mode structure light) with non-fully stripped ion beam cooled in a storage rings, arranging the ion beam in layers in radial direction of an energy-longitudinal coordinate plane and following rotation of the beam at the right angle after switching on the RF cavity or undulator grouper/buncher. Laser cooling of the ion beam can be used at this position after switching off the resonator to decrease the energy spread caused by accelerating field of the resonator. A relativistic multilayer ion mirror will be produced this way. Both monochromatic laser beams and intermediate monochromaticity and bandwidth light sources of spontaneous incoherent radiation can be used for production of hard and high power electromagnetic radiation by reflection from this mirror. The reflectivity of the mirror is rather high because of the cross-section of the backward Rayleigh scattering of photon light by non-fully stripped relativistic ions ({approximately}{lambda}{sup 2}) is much greater ({approximately} 10{divided_by}15 orders) then Thompson one ({approximately} r{sub e}{sup 2}). This position is valid even in the case of non-monochromatic laser light ({Delta}{omega}/{omega} {approximately} 10{sup -4}). Ion cooling both in longitudinal plane and three-dimensional radiation ion cooling had been proposed based on this observation. The using of these cooling techniques will permit to store high current and low emittance relativistic ion beams in storage rings. The bunched ion beam can be used in ordinary Free-Ion Lasers as well. After bunching the ion beam can be extracted from the storage ring in this case. Storage rings with zero momentum compaction function will permit to keep bunching of the ion beam for a long time.

  10. Monte Carlo simulations of nanoscale focused neon ion beam sputtering.

    PubMed

    Timilsina, Rajendra; Rack, Philip D

    2013-12-13

    A Monte Carlo simulation is developed to model the physical sputtering of aluminum and tungsten emulating nanoscale focused helium and neon ion beam etching from the gas field ion microscope. Neon beams with different beam energies (0.5-30 keV) and a constant beam diameter (Gaussian with full-width-at-half-maximum of 1 nm) were simulated to elucidate the nanostructure evolution during the physical sputtering of nanoscale high aspect ratio features. The aspect ratio and sputter yield vary with the ion species and beam energy for a constant beam diameter and are related to the distribution of the nuclear energy loss. Neon ions have a larger sputter yield than the helium ions due to their larger mass and consequently larger nuclear energy loss relative to helium. Quantitative information such as the sputtering yields, the energy-dependent aspect ratios and resolution-limiting effects are discussed. PMID:24231648

  11. Higher-order contributions to ion-acoustic solitary waves in a multicomponent plasma consisting of warm ions and two-component nonisothermal electrons

    SciTech Connect

    Das, K.P.; Majumdar, S.R.; Paul, S.N. ||

    1995-05-01

    An integrated form of the governing equations in terms of pseudopotential higher-order nonlinear and dispersive effects is obtained by applying the reductive perturbation method for ion-acoustic solitary waves in a collisionless unmagnetized multicomponent plasma having warm ions and two-component nonisothermal electrons. The present method is advantageous because instead of solving an inhomogeneous second-order differential equation at each order, as in the standard procedure, we solve a first-order inhomogeneous equation at each order except at the lowest. The expressions of both Mach number and width of the solitary wave are obtained as a function of the amplitude of the wave for third-order nonlinear and dispersive effects. The variations of potential, width, and Mach number against soliton amplitude are shown graphically, taking into consideration the nonisothermality of two-component electrons in the plasma.

  12. Caborane beam from ITEP Bernas ion source for semiconductor implanters

    SciTech Connect

    Seleznev, D.; Hershcovitch, A.; Kropachev, G.; Kozlov, A.; Kuibeda, R.; Koshelev, V.; Kulevoy, T.; Jonson, B.; Poole, J.; Alexeyenko, O.; Gurkova, E.; Oks, E.; Gushenets, V.; Polozov, S.; Masunov, E.

    2010-02-01

    A joint research and development of steady state intense boron ion sources for hundreds of electron-volt ion implanters has been in progress for the past 5 years. The difficulties of extraction and transportation of low energy boron beams can be solved by implanting clusters of boron atoms. In Institute for Theoretical and Experimental Physics (ITEP) the Bernas ion source successfully generated the beam of decaborane ions. The carborane (C{sub 2}B{sub 10}H{sub 12}) ion beam is more attractive material due to its better thermal stability. The results of carborane ion beam generation are presented. The result of the beam implantation into the silicon wafer is presented as well.

  13. Negative ion based neutral beam injector for JT-60U

    NASA Astrophysics Data System (ADS)

    Okumura, Y.; Araki, M.; Hanada, M.; Inoue, T.; Kunieda, S.; Kuriyama, M.; Matsuoka, M.; Mizuno, M.; Ohara, Y.; Tanaka, M.; Watanabe, K.

    1992-10-01

    A 500 keV, 10 MW neutral beam injector is to be constructed in JT-60 Upgrade for the experiments of current drive and heating of heat density core plasmas. This is the first neutral beam injector in the world using negative ions as the primary ions. In the design, D- ion beams of 44 A, 500 keV are produced by two ion sources (22 A/each ion source) and neutralized in a long gas neutralizer. The total system efficiency is about 40%. The ion source is a cesium-seeded multicusp volume source having a three stage electrostatic accelerator. To reduce the stripping loss of D- ions in the accelerator, the ion source should be operated at a low pressure of 0.3 Pa with a current density of 13 mA/cm2. The first test of the full-size negative ion source is scheduled from middle of 1993.

  14. Observation of Beam ION Instability in Spear3

    SciTech Connect

    Teytelman, D.; Cai, Y.; Corbett, W.J.; Raubenheimer, T.O.; Safranek, J.A.; Schmerge, J.F.; Sebek, J.J.; Wang, L.; /SLAC

    2011-12-14

    Weak vertical coupled bunch instability with oscillation amplitude at {mu}m level has been observed in SPEAR3. The instability becomes stronger when there is a vacuum pressure rise by partially turning off vacuum pumps and it becomes weaker when the vertical beam emittance is increased by turning off the skew quadrupole magnets. These confirmed that the instability was driven by ions in the vacuum. The threshold of the beam ion instability when running with a single bunch train is just under 200 mA. This paper presents the comprehensive observations of the beam ion instability in SPEAR3. The effects of vacuum pressure, beam current, beam filling pattern, chromaticity, beam emittance and bunch-by-bunch feedback are investigated in great detail. In an electron accelerator, ions generated from the residual gas molecules can be trapped by the beam. Then these trapped ions interact resonantly with the beam and cause beam instability and emittance blow-up. Most existing light sources use a long single bunch train filling pattern, followed by a long gap to avoid multi-turn ion trapping. However, such a gap does not preclude ions from accumulating during one passage of the single bunch train beam, and those ions can still cause a Fast Ion Instability (FII) as predicted by Raubenheimer and Zimmermann. FII has been observed in ALS, and PLS by artificially increasing the vacuum pressure by injecting helium gas into the vacuum chamber or by turning off the ion pumps in order to observe the beam ion instability. In some existing rings, for instance B factory, the beam ion instability was observed at the beginning of the machine operation after a long period of shutdown and then it automatically disappeared when the vacuum was better. However, when the beam emittance becomes smaller, the FII can occur at nominal conditions as observed in PLS, SOLEIL and SSRF. This paper reports the observations of beam ion instabilities in SPEAR3 under different condition during a period of one

  15. Ion Beam Sputtered Coatings of Bioglass

    NASA Technical Reports Server (NTRS)

    Hench, Larry L.; Wilson, J.; Ruzakowski, Patricia Henrietta Anne

    1982-01-01

    The ion beam sputtering technique available at the NASA-Lewis was used to apply coatings of bioglass to ceramic, metallic, and polymeric substrates. Experiments in vivo and in vitro described investigate these coatings. Some degree of substrate masking was obtained in all samples although stability and reactivity equivalent to bulk bioglass was not observed in all coated samples. Some degree of stability was seen in all coated samples that were reacted in vitro. Both metallic and ceramic substrates coated in this manner failed to show significantly improved coatings over those obtained with existing techniques. Implantation of the coated ceramic substrate samples in bone gave no definite bonding as seen with bulk glass; however, partial and patchy bonding was seen. Polymeric substrates in these studies showed promise of success. The coatings applied were sufficient to mask the underlying reactive test surface and tissue adhesion of collagen to bioglass was seen. Hydrophilic, hydrophobic, charged, and uncharged polymeric surfaces were successfully coated.

  16. Optics of ion beams for the neutral beam injection system on HL-2A Tokamak

    SciTech Connect

    Zou, G. Q.; Lei, G. J.; Cao, J. Y.; Duan, X. R.

    2012-07-15

    The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage ({approx}100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak.

  17. Optics of ion beams for the neutral beam injection system on HL-2A Tokamak.

    PubMed

    Zou, G Q; Lei, G J; Cao, J Y; Duan, X R

    2012-07-01

    The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage (∼100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak. PMID:22852685

  18. Prototyping of beam position monitor for medium energy beam transport section of RAON heavy ion accelerator

    NASA Astrophysics Data System (ADS)

    Jang, Hyojae; Jin, Hyunchang; Jang, Ji-Ho; Hong, In-Seok

    2016-02-01

    A heavy ion accelerator, RAON is going to be built by Rare Isotope Science Project in Korea. Its target is to accelerate various stable ions such as uranium, proton, and xenon from electron cyclotron resonance ion source and some rare isotopes from isotope separation on-line. The beam shaping, charge selection, and modulation should be applied to the ions from these ion sources because RAON adopts a superconducting linear accelerator structure for beam acceleration. For such treatment, low energy beam transport, radio frequency quadrupole, and medium energy beam transport (MEBT) will be installed in injector part of RAON accelerator. Recently, development of a prototype of stripline beam position monitor (BPM) to measure the position of ion beams in MEBT section is under way. In this presentation, design of stripline, electromagnetic (EM) simulation results, and RF measurement test results obtained from the prototyped BPM will be described.

  19. Prototyping of beam position monitor for medium energy beam transport section of RAON heavy ion accelerator.

    PubMed

    Jang, Hyojae; Jin, Hyunchang; Jang, Ji-Ho; Hong, In-Seok

    2016-02-01

    A heavy ion accelerator, RAON is going to be built by Rare Isotope Science Project in Korea. Its target is to accelerate various stable ions such as uranium, proton, and xenon from electron cyclotron resonance ion source and some rare isotopes from isotope separation on-line. The beam shaping, charge selection, and modulation should be applied to the ions from these ion sources because RAON adopts a superconducting linear accelerator structure for beam acceleration. For such treatment, low energy beam transport, radio frequency quadrupole, and medium energy beam transport (MEBT) will be installed in injector part of RAON accelerator. Recently, development of a prototype of stripline beam position monitor (BPM) to measure the position of ion beams in MEBT section is under way. In this presentation, design of stripline, electromagnetic (EM) simulation results, and RF measurement test results obtained from the prototyped BPM will be described. PMID:26932088

  20. An electron cyclotron resonance ion source based low energy ion beam platform.

    PubMed

    Sun, L T; Shang, Y; Ma, B H; Zhang, X Z; Feng, Y C; Li, X X; Wang, H; Guo, X H; Song, M T; Zhao, H Y; Zhang, Z M; Zhao, H W; Xie, D Z

    2008-02-01

    To satisfy the requirements of surface and atomic physics study in the field of low energy multiple charge state ion incident experiments, a low energy (10 eV/q-20 keV/q) ion beam platform is under design at IMP. A simple test bench has been set up to test the ion beam deceleration systems. Considering virtues such as structure simplicity, easy handling, compactness, cost saving, etc., an all-permanent magnet ECRIS LAPECR1 [Lanzhou all-permanent magnet electron cyclotron resonance (ECR) ion source No. 1] working at 14.5 GHz has been adopted to produce intense medium and low charge state ion beams. LAPECR1 source has already been ignited. Some intense low charge state ion beams have been produced on it, but the first test also reveals that many problems are existing on the ion beam transmission line. The ion beam transmission mismatches result in the depressed performance of LAPECR1, which will be discussed in this paper. To obtain ultralow energy ion beam, after being analyzed by a double-focusing analyzer magnet, the selected ion beam will be further decelerated by two afocal deceleration lens systems, which is still under design. This design has taken into consideration both ions slowing down and also ion beam focusing. In this paper, the conceptual design of deceleration system will be discussed. PMID:18315202

  1. Ion beam sputter deposited zinc telluride films

    NASA Technical Reports Server (NTRS)

    Gulino, D. A.

    1985-01-01

    Zinc telluride is of interest as a potential electronic device material, particularly as one component in an amorphous superlattice, which is a new class of interesting and potentially useful materials. Some structural and electronic properties of ZnTe films deposited by argon ion beam sputter depoairion are described. Films (up to 3000 angstroms thick) were deposited from a ZnTe target. A beam energy of 1000 eV and a current density of 4 mA/sq. cm. resulted in deposition rates of approximately 70 angstroms/min. The optical band gap was found to be approximately 1.1 eV, indicating an amorphous structure, as compared to a literature value of 2.26 eV for crystalline material. Intrinsic stress measurements showed a thickness dependence, varying from tensile for thicknesses below 850 angstroms to compressive for larger thicknesses. Room temperature conductivity measurement also showed a thickness dependence, with values ranging from 1.86 x to to the -6/ohm. cm. for 300 angstrom film to 2.56 x 10 to the -1/ohm. cm. for a 2600 angstrom film. Measurement of the temperature dependence of the conductivity for these films showed complicated behavior which was thickness dependent. Thinner films showed at least two distinct temperature dependent conductivity mechanisms, as described by a Mott-type model. Thicker films showed only one principal conductivity mechanism, similar to what might be expected for a material with more crystalline character.

  2. Ion beam sputter deposited zinc telluride films

    NASA Technical Reports Server (NTRS)

    Gulino, D. A.

    1986-01-01

    Zinc telluride is of interest as a potential electronic device material, particularly as one component in an amorphous superlattice, which is a new class of interesting and potentially useful materials. Some structural and electronic properties of ZnTe films deposited by argon ion beam sputter deposition are described. Films (up to 3000 angstroms thick) were deposited from a ZnTe target. A beam energy of 1000 eV and a current density of 4 mA/sq cm resulted in deposition rates of approximately 70 angstroms/min. The optical band gap was found to be approximately 1.1 eV, indicating an amorphous structure, as compared to a literature value of 2.26 eV for crystalline material. Intrinsic stress measurements showed a thickness dependence, varying from tensile for thicknesses below 850 angstroms to compressive for larger thicknesses. Room temperature conductivity measurement also showed a thickness dependence, with values ranging from 1.86 x 10 to the -6th/ohm cm for 300 angstrom film to 2.56 x 10 to the -1/ohm cm for a 2600 angstrom film. Measurement of the temperature dependence of the conductivity for these films showed complicated behavior which was thickness dependent. Thinner films showed at least two distinct temperature dependent conductivity mechanisms, as described by a Mott-type model. Thicker films showed only one principal conductivity mechanism, similar to what might be expected for a material with more crystalline character.

  3. Ion beam driven ion-acoustic waves in a plasma cylinder with negative ions

    SciTech Connect

    Sharma, Suresh C.; Gahlot, Ajay

    2008-07-15

    An ion beam propagating through a magnetized plasma cylinder containing K{sup +} positive ions, electrons, and SF{sub 6}{sup -} negative ions drives electrostatic ion-acoustic (IA) waves to instability via Cerenkov interaction. Two electrostatic IA wave modes in presence of K{sup +} and SF{sub 6}{sup -} ions are studied. The phase velocity of the sound wave in presence of positive and negative ions increase with the relative density of negative ions. The unstable wave frequencies and the growth rate of both the modes in presence of positive and negative ions increase with the relative density of negative ions. The growth rate of both the unstable modes in presence of SF{sub 6}{sup -} and K{sup +} ions scales as the one-third power of the beam density. Numerical calculations of the phase velocity, growth rate, and mode frequencies have been carried out for the parameters of the experiment of Song et al. [Phys. Fluids B 3, 284 (1991)].

  4. Simulations and Observations of Heating of Auroral Ion Beams

    NASA Technical Reports Server (NTRS)

    Winglee, R. M.; Dusenbery, P. B.; Collin, H. L.; Lin, C. S.; Persoon, A. M.

    1989-01-01

    In the auroral zone, quasi-static parallel electric fields produce beams of ionospheric ions (e.g., H(+), He(+) and 0(+)), which flow outward into the magnetosphere, providing a significant source of ions for the ring current and plasma sheet. Because the velocities to which these beams are accelerated is dependent on the mass of the ions, differential flows between the various ion species can develop which are unstable to an ion-ion streaming instability. Particle simulations and observations from DE 1 are used to investigate the heating of the ion beams produced by this instability. It is shown that there is net transfer of energy from the light ions to the heavy ions, with the heavy ions reaching maximum velocities near the beam velocity of the light ions. Bulk heating of the heavy ions occurs when their relative density is low while high-energy tails are produced when their relative density is high. The heating is primarily parallel to the magnetic field if the difference in the heavy and light ion beam velocities is subsonic while both perpendicular and parallel heating can occur if it is supersonic. In the latter case, very strong heating of an intermediate ion's species such as He(+) can also occur. Comparison with observations shows features consistent with heating via the ion-ion instability including perpendicular heating in the supersonic regime and parallel heating in the subsonic regime and a change in the heating between these regimes as the ratio of the H(+) beam speed to the local sound speed is observed to decrease. This heating is, however, not always observed in association with enhanced wave emissions. This lack of waves is attributed to reabsorption of the waves as the ions become heated.

  5. NRL light ion beam research for inertial confinement fusion

    NASA Astrophysics Data System (ADS)

    Cooperstein, G.; Goldstein, S. A.; Mosher, D.; Barker, R. J.; Boller, J. R.; Colombant, D. G.; Drobot, A.; Meger, R. A.; Oliphant, W. F.; Ottinger, P. F.

    1980-11-01

    There is presently great interest in using light ions beams to drive thermonuclear pellets. Terrawatt-level ion beams have been efficiently produced using conventional pulsed power generators at Sandia Laboratory with magnetically-insulated ion diodes and at the Naval Research Laboratory with pinch-reflex ion diodes. Both laboratories have recently focused ion beams to pellet dimensions. This paper reviews recent advances made at NRL in the area of ion production with pinch-reflex diodes, and in the areas of beam focusing and transport. In addition, modulator generator and beam requirements for pellet ignition systems are reviewed and compared with the latest experimental results. These results include the following: (1) production of = or - 100,100 kj proton and deuteron beams with peak ion powers approaching 2 TW on the PITHON generator in collaboration with Physics International Co., (2) focusing of 0.5 TW deuteron beams produced on the NRL Gamble 2 generator to current densities of about 300 kA/sq cm, and (3) efficient transport of 100 kA level ion beams over 1 meter distances using Z-discharge plasma channels.

  6. Production of multiply charged ion beams from solid substances with the mVINIS ion source

    SciTech Connect

    Draganic, I.; Dobrosavljevic, A.; Nedeljkovic, T.; Siljegovic, M.

    2006-03-15

    The mVINIS ion source has enabled us to obtain multiply charged ion beams from gases as well as from solid materials. The solid substance ion beams were produced by using two techniques: (a) the evaporation of metals by using the inlet system based on a minioven and (b) the metal-ions-from-volatile-compounds method (MIVOC) by using the modified gas inlet system. Great efforts were made in the production of high current stable ion beams of solids with relatively high melting points (over 1000 deg. C). The B{sup 3+} ion-beam current of over 300 {mu}A was one of the most intensive beams extracted until now. The obtained multiply charged ion-beam spectra of solid substances (B, Fe, and Zn) are presented as well as some of the corresponding experimental results achieved during the modification of polymers, carbon materials, and fullerenes.

  7. Nanopore Sculpting with Low Energy Ion Beam of Noble Gases

    NASA Astrophysics Data System (ADS)

    Cai, Qun; Ledden, Brad; Krueger, Eric; Golovchenko, Jene; Li, Jiali

    2005-03-01

    Experiments show that 3keV Helium, Neon, Argon, Krypton, and Xenon ion beams can be used to controllably ``sculpt'' nanoscale features in silicon nitride films using a feedback controlled ion beam sculpting apparatus. Here we report nanopore ion beam sculpting effects that depend on the inert gas ion species. We demonstrate that: (1) all the noble gas ion beams enable single nanometer control of structural dimensions in nanopores; (2) every ion species above shows similar ion beam flux dependence of nanopore formation, (3) the thickness of nanopores sculpted with different inert gas ion beam is deferent. Computer simulations (with SRIM and TRIM) and an ``adatom'' surface diffusion model are employed to explain the dynamics of nanoscale dimension change by competing sputtering and surface mass transport processes induced by different ion beam irradiation. These experiments and theoretical work reveal the surface atomic transport phenomena in a quantitative way that allows the extraction of parameters such as the adatom surface diffusion coefficients and average travel distances.

  8. Surface modification using low energy ground state ion beams

    NASA Technical Reports Server (NTRS)

    Chutjian, Ara (Inventor); Hecht, Michael H. (Inventor); Orient, Otto J. (Inventor)

    1990-01-01

    A method of effecting modifications at the surfaces of materials using low energy ion beams of known quantum state, purity, flux, and energy is presented. The ion beam is obtained by bombarding ion-generating molecules with electrons which are also at low energy. The electrons used to bombard the ion generating molecules are separated from the ions thus obtained and the ion beam is directed at the material surface to be modified. Depending on the type of ion generating molecules used, different ions can be obtained for different types of surface modifications such as oxidation and diamond film formation. One area of application is in the manufacture of semiconductor devices from semiconductor wafers.

  9. Plasma and ion barrier for electron beam spot stability

    SciTech Connect

    Kwan, Thomas J. T.; Snell, Charles M.

    2000-03-01

    High-current electron beams of small spot size are used for high-resolution x-ray radiography of dense objects. Intense energy deposition in the bremsstrahlung target causes generation of ions which can propagate upstream and disrupt the electron beam. We have investigated the use of a thin beryllium foil placed 1-2 cm in front of the target, which serves as a barrier for the ions but is essentially transparent to the incoming electron beam. Analysis and computer simulations confirm that this confinement method will halt ion propagation and preserve the spot size stability of the electron beam. (c) 2000 American Institute of Physics.

  10. Status of radioactive ion beams at the HRIBF

    NASA Astrophysics Data System (ADS)

    Stracener, D. W.

    2003-05-01

    Radioactive Ion Beams (RIBs) at the Holifield Radioactive Ion Beam Facility (HRIBF) are produced using the isotope separation on-line technique and are subsequently accelerated up to a few MeV per nucleon for use in nuclear physics experiments. The first RIB experiments at the HRIBF were completed at the end of 1998 using 17F beams. Since then other proton-rich ion beams have been developed and a large number of neutron-rich ion beams are now available. The neutron-rich radioactive nuclei are produced via proton-induced fission of uranium in a low-density matrix of uranium carbide. Recently developed RIBs include 25Al from a silicon carbide target and isobarically pure beams of neutron-rich Ge, Sn, Br and I isotopes from a uranium carbide target.