Science.gov

Sample records for non-specular x-ray reflection

  1. Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements

    SciTech Connect

    Biswas, A. Bhattacharyya, D.; Sahoo, N. K.; Maidul Haque, S.; Tripathi, S.; De, Rajnarayan; Rai, S.

    2015-10-28

    W/C/W tri-layer thin film samples have been deposited on c-Si substrates in a home-built Ion Beam Sputtering system at 1.5 × 10{sup −3} Torr Ar working pressure and 10 mA grid current. The tri-layer samples have been deposited at different Ar{sup +} ion energies between 0.6 and 1.2 keV for W layer deposition and the samples have been characterized by specular and non-specular grazing incidence X-ray reflectivity (GIXR) measurements. By analyzing the GIXR spectra, various interface parameters have been obtained for both W-on-C and C-on-W interfaces and optimum Ar{sup +} ion energy for obtaining interfaces with low imperfections has been found. Subsequently, multilayer W/C samples with 5-layer, 7-layer, 9-layer, and 13-layer have been deposited at this optimum Ar{sup +} ion energy. By fitting the specular and diffused GIXR data of the multilayer samples with the parameters of each interface as fitting variables, different interface parameters, viz., interface width, in-plane correlation length, interface roughness, and interface diffusion have been estimated for each interface and their variation across the depth of the multilayers have been obtained. The information would be useful in realizing W/C multilayers for soft X-ray mirror application in the <100 Å wavelength regime. The applicability of the “restart of the growth at the interface” model in the case of these ion beam sputter deposited W/C multilayers has also been investigated in the course of this study.

  2. Evaluation of non-specular reflecting silvered Teflon and filled adhesives

    NASA Technical Reports Server (NTRS)

    Bourland, G.; Cox, R. L.

    1981-01-01

    A non-specular silver-Teflon tape thermal control coating was tested to provide the data necessary to qualify it for use on the Space Shuttle Orbiter radiators. Effects of cure cycle temperature and pressure on optical and mechanical properties on the silver-Teflon tape were evaluated. The baseline Permacel P-223 adhesive, used with the specular silver-Teflon tape initially qualified for the Orbiter radiators, and four alternate metal-filled and unfilled adhesives were evaluated. Tests showed the cure process has no effect on the silver-Teflon optical properties, and that the baseline adhesive cure cycle gives best results. In addition the P-223 adhesive bond is more reproducible than the alternates, and the non-specular tape meets both the mechanical and the optical requirements of the Orbiter radiator coating specification. Existing Orbiter coating techniques were demonstrated to be effective in aplying the non-specular tape to a curved panel simulating the radiators. Author

  3. X-ray reflectivity and surface roughness

    SciTech Connect

    Ocko, B.M.

    1988-01-01

    Since the advent of high brightness synchrotron radiation sources there has been a phenomenal growth in the use of x-rays as a probe of surface structure. The technique of x-ray reflectivity is particularly relevant to electrochemists since it is capable of probing the structure normal to an electrode surface in situ. In this paper the theoretical framework for x-ray reflectivity is reviewed and the results from previous non-electrochemistry measurements are summarized. These measurements are from the liquid/air interface (CCl/sub 4/), the metal crystal vacuum interface (Au(100)), and from the liquid/solid interface(liquid crystal/silicon). 34 refs., 5 figs.

  4. Non-specular meteor trail diagnostics

    NASA Astrophysics Data System (ADS)

    Dyrud, L.; Oppenheim, M.; Close, S.; Ray, L.; McMillion, K.

    2003-12-01

    Plasma simulations demonstrate that meteor trails are unstable to growth of gradient-drift Farley-Buneman (GDFB) waves that become turbulent and generate large B-field aligned irregularities (FAI). These simulations and our analysis indicate that the non-specular echos, that can extend between 5-10 km in altitude range, are reflections from plasma instability generated FAI. We present models showing that the specific altitude range of trail instability depends on meteor and atmospheric properties. This variability will allow researchers to infer neutral temperature, neutral wind velocity, and meteoric velocity and composition in completely new ways. We demonstrate some of these non-specular trail diagnostic techniques using radar observations from the ALTAIR and Piura radar facilities. Finally, we present examples of a low altitude variety of non-specular echos that may be related to PMSE.

  5. Reflection soft X-ray microscope and method

    DOEpatents

    Suckewer, Szymon; Skinner, Charles H.; Rosser, Roy

    1993-01-01

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  6. Reflection soft X-ray microscope and method

    DOEpatents

    Suckewer, S.; Skinner, C.H.; Rosser, R.

    1993-01-05

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  7. Evolution of ion distributions across the nearly perpendicular bow shock - Specularly and non-specularly reflected-gyrating ions

    NASA Technical Reports Server (NTRS)

    Sckopke, N.; Paschmann, G.; Bame, S. J.; Gosling, J. T.; Russell, C. T.

    1983-01-01

    Data from ISEE 1 and 2 spacecraft were used to study the evolution of the ion distributions in the perpendicular terrestrial bow shock. The plasma data were taken during passage of the spacecraft downstream of and through the shock. Solar wind ions had velocities ranging from Mach 2-12.4, and reflected ions featured a relative density of 1-3 percent of the solar wind density at Mach 2 to 15-25 percent at Mach 8-12. Computer simulations have indicated that the ions provide essential dissipation at the shock and gyrate about the magnetic field lines in the plasma rest frame at a speed twice that of the normal incident solar wind flow. The ion density decreases by up to two orders of magnitude at the forward end of the foot of the shock profile, suggesting that the ions are reflected by the shock specularly, and may enhance downstream ion thermalization.

  8. X-ray Reflectivity by Rough Multilayers

    NASA Astrophysics Data System (ADS)

    Baumbach, Tilo; Mikulik, Petr

    One tendency in present material research is the increasing ability to structure solids in one, two and three dimensions at a sub-micrometer scale. Based on various material systems artificial mesoscopic layered superstructures such as multilayers, superlattices, layered gratings, quantum wires and dots have been fabricated successfully. This has opened new perspectives for manifold technological applications (e.g. for anticorrosion coating and hard coating, micro and optoelectronic devices, neutron and x-ray optical elements, magnetooptical recording).

  9. Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

    SciTech Connect

    Eckert, S. E-mail: martin.beye@helmholtz-berlin.de; Beye, M. E-mail: martin.beye@helmholtz-berlin.de; Pietzsch, A.; Quevedo, W.; Hantschmann, M.; Ochmann, M.; Huse, N.; Ross, M.; Khalil, M.; Minitti, M. P.; Turner, J. J.; Moeller, S. P.; Schlotter, W. F.; Dakovski, G. L.; Föhlisch, A.

    2015-02-09

    The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response.

  10. Near-100 percent Bragg Reflectivity of X-rays

    SciTech Connect

    Y Shvydko; S Stoupin; V Blank; S Terentyev

    2011-12-31

    Ultrahigh-reflectance mirrors are essential optical elements of the most sophisticated optical instruments devised over the entire frequency spectrum. In the X-ray regime, super-polished mirrors with close to 100% reflectivity are routinely used at grazing angles of incidence. However, at large angles of incidence, and particularly at normal incidence, such high reflectivity has not yet been achieved. Here, we demonstrate by direct measurements that synthetic, nearly defect-free diamond crystals reflect more than 99% of hard X-ray photons backwards in Bragg diffraction, with a remarkably small variation in magnitude across the sample. This is a quantum leap in the largest reflectivity measured to date, which is at the limit of what is theoretically possible. This accomplishment is achieved under the most challenging conditions of normal incidence and with extremely hard X-ray photons.

  11. Measurements of the hard-x-ray reflectivity of iridium

    SciTech Connect

    Romaine, S.; Bruni, R.; Gorenstein, P.; Zhong, Z

    2007-01-10

    In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.

  12. Lensless x-ray imaging in reflection geometry

    SciTech Connect

    Roy, S.; Parks, D.H.; Seu, K.A.; Turner, J.J.; Chao, W.; Anderson, E.H.; Cabrini, S.; Kevan, S.D.; Su, R.

    2011-02-03

    Lensless X-ray imaging techniques such as coherent diffraction imaging and ptychography, and Fourier transform holography can provide time-resolved, diffraction-limited images. Nearly all examples of these techniques have focused on transmission geometry, restricting the samples and reciprocal spaces that can be investigated. We report a lensless X-ray technique developed for imaging in Bragg and small-angle scattering geometries, which may also find application in transmission geometries. We demonstrate this by imaging a nanofabricated pseudorandom binary structure in small-angle reflection geometry. The technique can be used with extended objects, places no restriction on sample size, and requires no additional sample masking. The realization of X-ray lensless imaging in reflection geometry opens up the possibility of single-shot imaging of surfaces in thin films, buried interfaces in magnetic multilayers, organic photovoltaic and field-effect transistor devices, or Bragg planes in a single crystal.

  13. X-ray reflectivity measurements of vacuum deposited thin films

    SciTech Connect

    Chason, M.; Chason, E.

    1992-12-31

    X-ray reflectivity using energy dispersive X-ray detection, a nondestructive probe of surface roughness over the region of {approximately} 1--50 {Angstrom}, has been used to investigate the characteristicsof vacuum deposited thin films. With a surface roughness sensitivity better than 1 {Angstrom} X-ray reflectivity is sensitive to interfaces between different materials for sample thicknesses up to approximately2000 {Angstrom} (depending on material density). We have investigated discrete Cr/Al deposits on quartz substrates and determined the surface roughness at the interfaces. We have also monitored the evolution ofthe Cr/Al interface following annealing. The experimental data is presented and discussed. The use of the technique for studying thin film deposits is addressed.

  14. X-ray reflectivity measurements of vacuum deposited thin films

    SciTech Connect

    Chason, M. ); Chason, E. )

    1992-01-01

    X-ray reflectivity using energy dispersive X-ray detection, a nondestructive probe of surface roughness over the region of [approximately] 1--50 [Angstrom], has been used to investigate the characteristicsof vacuum deposited thin films. With a surface roughness sensitivity better than 1 [Angstrom] X-ray reflectivity is sensitive to interfaces between different materials for sample thicknesses up to approximately2000 [Angstrom] (depending on material density). We have investigated discrete Cr/Al deposits on quartz substrates and determined the surface roughness at the interfaces. We have also monitored the evolution ofthe Cr/Al interface following annealing. The experimental data is presented and discussed. The use of the technique for studying thin film deposits is addressed.

  15. X-ray Reflection Gratings: Technology Development Status Update

    NASA Astrophysics Data System (ADS)

    McEntaffer, Randall L.

    2016-04-01

    We present the current status in the development of X-ray reflection gratings. Gratings mounted in the off-plane configuration are capable of achieving high spectral resolving power concurrently with high diffraction efficiency. This will enable key soft X-ray spectroscopy science goals to be achieved. We have identified hurdles to practically achieving the theoretical performance goals. Here we present our methodologies to overcome these challenges. Furthermore, we discuss how we test these methods to quantify performance capabilities. The results of these tests are placed in the context of Technology Readiness Level (TRL) in order to demonstrate our current status and to discuss our plans for the future.

  16. The theoretical reflectance of X-rays from optical surfaces

    NASA Technical Reports Server (NTRS)

    Neergaard, J. R.; Reynolds, J. M.; Fields, S. A.

    1976-01-01

    The theoretical reflectance of X-rays from various materials and evaporated films is presented. A computer program was written that computes the reflected intensity as a function of the angle of the incident radiation. The quantities necessary to generate the efficiency and their effect on the data are demonstrated. Five materials were chosen for evaluation: (1) fused silica, (2) chromium, (3) beryllium, (4) gold, and (5) a thin layer contaminant. Fused silica is a versatile and common material; chromium has high reflection efficiency at X-ray wavelengths and is in the middle of the atomic number range; beryllium contains a single atomic shell and has a low range atomic number; gold contains multiple atomic shells and has a high atomic number; the contaminant is treated as a thin film in the calculations and results are given as a function of thickness for selected wavelengths. The theoretical results are compared to experimental data at lambda = 8.34 A.

  17. Relativistic Effects on Reflection X-ray Spectra of AGN

    SciTech Connect

    Lee, Khee-Gan; Fuerst, Steven V.; Brandwardi-Raymond, Graziella; Wu, Kinwah; Crowley, Oliver; /University Coll. London

    2007-01-05

    We have calculated the reflection component of the X-ray spectra of active galactic nuclei (AGN) and shown that they can be significantly modified by the relativistic motion of the accretion flow and various gravitational effects of the central black hole. The absorption edges in the reflection spectra suffer severe energy shifts and smearing. The degree of distortion depends on the system parameters, and the dependence is stronger for some parameters such as the inner radius of the accretion disk and the disk viewing inclination angles. The relativistic effects are significant and are observable. Improper treatment of the reflection component of the X-ray continuum in spectral fittings will give rise to spurious line-like features, which will mimic the fluorescent emission lines and mask the relativistic signatures of the lines.

  18. Revealing accretion onto black holes through X-ray reflection

    NASA Astrophysics Data System (ADS)

    Plant, D.; Fender, R.; Ponti, G.; Munoz-Darias, T.; Coriat, M.

    2014-07-01

    Understanding the dynamics behind black hole state transitions and the changes they reflect in outbursts has become long-standing problem. The X-ray reflection spectrum describes the interaction between the hard X-ray source (the power-law continuum) and the cool accretion disc it illuminates, and thus permits an indirect view of how the two evolve. We present a systematic analysis of the reflection spectrum throughout three outbursts (500+ RXTE observations) of the black hole binary GX 339-4, representing the largest study applying a self-consistent treatment of reflection to date. Particular attention is payed to the coincident evolution of the power-law and reflection, which can be used to determine the accretion geometry. The hard state is found to be distinctly reflection weak, however the ratio of reflection to power-law gradually increases as the source luminosity rises. In contrast the reflection is found dominate the power-law throughout most of the soft state, with increasing supremacy as the source decays. Using results from archival and AO-12 observations of GX 339-4 with XMM-Newton we reveal the dynamics driving this evolution and the nature of accretion onto black holes in outburst.

  19. Backscatter of hard X-rays in the solar atmosphere. [Calculating the reflectance of solar x ray emission

    NASA Technical Reports Server (NTRS)

    Bai, T.; Ramaty, R.

    1977-01-01

    The solar photosphere backscatters a substantial fraction of the hard X rays from solar flares incident upon it. This reflection was studied using a Monte Carlo simulation which takes into account Compton scattering and photo-electric absorption. Both isotropic and anisotropic X ray sources are considered. The bremsstrahlung from an anisotropic distribution of electrons are evaluated. By taking the reflection into account, the inconsistency is removed between recent observational data regarding the center-to-limb variation of solar X ray emission and the predictions of models in which accelerated electrons are moving down toward the photosphere.

  20. Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves

    NASA Astrophysics Data System (ADS)

    Shcherbina, M. A.; Chvalun, S. N.; Ponomarenko, S. A.; Kovalchuk, M. V.

    2014-12-01

    The review concerns modern experimental methods of structure determination of thin films of different nature. The methods are based on total reflection of X-rays from the surface and include X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Their potential is exemplified by the investigations of various organic macromolecular systems that exhibit the properties of semiconductors and are thought to be promising as thin-film transistors, light-emitting diodes and photovoltaic cells. It is shown that combination of the title methods enable high-precision investigations of the structure of thin-film materials and structure formation in them, i.e., it is possible to obtain information necessary for improvement of the operating efficiency of elements of organic electronic devices. The bibliography includes 92 references.

  1. Compact X-ray sources: X-rays from self-reflection

    NASA Astrophysics Data System (ADS)

    Mangles, Stuart P. D.

    2012-05-01

    Laser-based particle acceleration offers a way to reduce the size of hard-X-ray sources. Scientists have now developed a simple scheme that produces a bright flash of hard X-rays by using a single laser pulse both to generate and to scatter an electron beam.

  2. Reflective Coating for Lightweight X-Ray Optics

    NASA Technical Reports Server (NTRS)

    Chan, Kai-Wing; Zhang, William W.; Windt, David; Hong, Mao-Ling; Saha, Timo; McClelland, Ryan; Sharpe, Marton; Dwivedi, Vivek H.

    2012-01-01

    X-ray reflective coating for next generation's lightweight, high resolution, optics for astronomy requires thin-film deposition that is precisely fine-tuned so that it will not distort the thin sub-mm substrates. Film of very low stress is required. Alternatively, mirror distortion can be cancelled by precisely balancing the deformation from multiple films. We will present results on metallic film deposition for the lightweight optics under development. These efforts include: low-stress deposition by magnetron sputtering and atomic layer deposition of the metals, balancing of gross deformation with two-layer depositions of opposite stresses and with depositions on both sides of the thin mirrors.

  3. X-ray natural birefringence in reflection from graphene

    NASA Astrophysics Data System (ADS)

    Jansing, C.; Mertins, H.-Ch.; Gilbert, M.; Wahab, H.; Timmers, H.; Choi, S.-H.; Gaupp, A.; Krivenkov, M.; Varykhalov, A.; Rader, O.; Legut, D.; Oppeneer, P. M.

    2016-07-01

    The existence of natural birefringence in x-ray reflection on graphene is demonstrated at energies spanning the carbon 1 s absorption edge. This new x-ray effect has been discovered with precision measurements of the polarization-plane rotation and the polarization-ellipticity changes that occur upon reflection of linearly polarized synchrotron radiation on monolayer graphene. Extraordinarily large polarization-plane rotations of up to 30∘, accompanied by a change from linearly to circularly polarized radiation have been measured for graphene on copper. Graphene on single crystalline cobalt, grown on tungsten, exhibits rotation values of up to 17∘. Both graphene systems show resonantly enhanced effects at the π* and σ* energies. The results are referenced against those obtained for polycrystalline carbon and highly oriented pyrolytic graphite (HOPG), respectively. As expected, polycrystalline carbon shows negligible rotation, whereas a huge maximum rotation of 140∘ has been observed for HOPG that may be considered a graphene multilayer system. HOPG is found to exhibit such large rotation values over a broad energy range, even well beyond the π* resonance energy due to the contributions of numerous graphene layers. To explain the origin of the observed natural birefringence of graphene, the Stokes parameters as well as the x-ray natural linear dichroism in reflection have been determined. It is shown that the birefringence directly results from the optical anisotropy related to the orthogonal alignment of π* and σ* bonds in the graphene layer. Our polarization analysis reveals a strong bonding of graphene on Co with a reduced σ* excitation energy and a strong tilt of 50 % of the pz orbitals towards diagonal orientation. In contrast, graphene on Cu is weakly bound with an orthogonal orientation of the pz orbitals. Exhibiting such a large natural birefringence that can be controlled through substrate choice, and because of excellent heat conductivity

  4. Lead adsorption at the calcite-water interface: Synchrotron x-ray standing wave and x-ray reflectivity studies

    SciTech Connect

    Sturchio, N.C.; Chiarello, R.P.; You, Hoydoo

    1997-01-01

    By combining synchrotron X-ray standing wave (XSW) measurements with synchrotron X-ray reflectivity measurements, we have determined: (1) the precise three-dimensional location within the calcite unit cell of submonolayer Pb ions adsorbed at the calcite (104) surface from dilute aqueous solutions, and (2) the precise one-dimensional location of these unit cells relative to the calcite surface. Our XSW measurements, using three separate calcite Bragg reflections for triangulation, show that most adsorbed Pb ions occupy Ca sites in the calcite lattice with an ordered coverage of 0.05 equivalent monolayers, while the remaining Pb ions are disordered with a coverage of 0.03 equivalent monolayers. Our X-ray reflectivity measurements show that the ordered Ph ions occur primarily (>70%) in the surface atomic layer of calcite. Atomic force microscopy (AFM) was used to characterize the topography of the calcite (104) surface under conditions similar to the X-ray experiments. The quantitative morphological information obtained by AFM was used to develop realistic models of the calcite surface. The calculated X-ray reflectivities for these model surfaces were compared with the measured X-ray reflectivities. The new combined X-ray method that we have developed can be used to determine the atomic-scale structure of other metals adsorbed at mineral-water interfaces. Such high-resolution structural determinations are essential before detailed conceptual and theoretical models can be further developed to understand and predict the behavior of dissolved metals in mineral-water systems. 60 refs., 8 figs., 3 tabs.

  5. An experimental measurement of metal multilayer x-ray reflectivity degradation due to intense x-ray flux

    SciTech Connect

    Hockaday, M.Y.P.

    1987-06-01

    The degradation of the x-ray reflection characteristics of metal multilayer Bragg diffractors due to intense x-ray flux was investigated. The Z-pinch plasma produced by PROTO II of Sandia National Laboratories, Albuquerque, New Mexico, was used as the source. The plasma generated total x-ray yields of as much as 40 kJ with up to 15 kJ in the neon hydrogen- and helium-like resonance lines in nominal 20-ns pulses. Molybdenum-carbon, palladium-carbon, and tungsten-carbon metal multilayers were placed at 15 and 150 cm from the plasma center. The multilayers were at nominal angles of 5/sup 0/ and 10/sup 0/ to diffract the neon resonance lines. The time-integrated x-ray reflection of the metal multilayers was monitored by x-ray film. A fluorescer-fiber optic-visible streak camera detector system was then used to monitor the time-resolved x-ray reflection characteristics of 135 A- 2d tungsten-carbon multilayers. A large specular component in the reflectivity prevented determination of the rocking curve of the multilayer. For a neon implosion onto a vanadium-doped polyacrylic acid foam target shot, detailed modeling was attempted. The spectral flux was determined with data from 5 XRD channels and deconvolved using the code SHAZAM. The observed decay in reflectivity was assumed to correspond to the melting of the first tungsten layer. A ''conduction factor'' of 82 was required to manipulate the heat loading of the first tungsten layer such that the time of melting corresponded to the observed decay. The power at destruction was 141 MW/cm/sup 2/ and the integrated energy at destruction was 2.0 J/cm/sup 2/. 82 refs., 66 figs., 10 tabs.

  6. Testing black holes via X-ray reflection spectroscopy

    NASA Astrophysics Data System (ADS)

    Bambi, Cosimo; Nampalliwar, Sourabh; Cardenas-Avendano, Alejandro

    2016-07-01

    Astrophysical black hole candidates are thought to be the Kerr black holes of general relativity. However, a direct observational evidence is still lacking. The study of the properties of the radiation emitted by gas in the inner part of the accretion disk can provide useful information on the spacetime geometry around these compact objects and test the Kerr black hole hypothesis. The iron line method is the most promising techniques to test black hole candidates. In this talk, we present a new reflection model for testing the Kerr black hole hypothesis. We use the formalism of the transfer function and we split the calculations into two blocks. One is the calculation of the transfer function, which takes into account all the relativistic effects and only depends on the background metric. The second block is the calculation of the intrinsic spectrum in the rest frame of the gas. We have developed a code to compute transfer functions in arbitrary stationary and axisymmetric spacetimes. The transfer functions are tabulated in FITS files and combined with XILLVER, which is the best reflection code available today. The result is best model to test black hole candidates via X-ray reflection spectroscopy.

  7. Quo Vadis total reflection X-ray fluorescence?

    NASA Astrophysics Data System (ADS)

    Pahlke, Siegfried

    2003-12-01

    The multielement trace analytical method 'total reflection X-ray fluorescence' (TXRF) has become a successfully established method in the semiconductor industry, particularly, in the ultra trace element analysis of silicon wafer surfaces. TXRF applications can fulfill general industrial requirements on daily routine of monitoring wafer cleanliness up to 300 mm diameter under cleanroom conditions. Nowadays, TXRF and hyphenated TXRF methods such as 'vapor phase decomposition (VPD)-TXRF', i.e. TXRF with a preceding surface and acid digestion and preconcentration procedure, are automated routine techniques ('wafer surface preparation system', WSPS). A linear range from 10 8 to 10 14 [atoms/cm 2] for some elements is regularly controlled. Instrument uptime is higher than 90%. The method is not tedious and can automatically be operated for 24 h/7 days. Elements such as S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Br, Sn, Sb, Ba and Pb are included in the software for standard peak search. The detection limits of recovered elements are between 1×10 11 and 1×10 7 [atoms/cm 2] depending upon X-ray excitation energy and the element of interest. For the determination of low Z elements, i.e. Na, Al and Mg, TXRF has also been extended but its implementation for routine analysis needs further research. At present, VPD-TXRF determination of light elements is viable in a range of 10 9 [atoms/cm 2]. Novel detectors such as silicon drift detectors (SDD) with an active area of 5 mm 2, 10 mm 2 or 20 mm 2, respectively, and multi-array detectors forming up to 70 mm 2 are commercially available. The first SDD with 100 mm 2 (!) area and integrated backside FET is working under laboratory conditions. Applications of and comparison with ICP-MS, HR-ICP-MS and SR-TXRF, an extension of TXRF capabilities with an extremely powerful energy source, are also reported.

  8. Measurement uncertainty in Total Reflection X-ray Fluorescence

    NASA Astrophysics Data System (ADS)

    Floor, G. H.; Queralt, I.; Hidalgo, M.; Marguí, E.

    2015-09-01

    Total Reflection X-ray Fluorescence (TXRF) spectrometry is a multi-elemental technique using micro-volumes of sample. This work assessed the components contributing to the combined uncertainty budget associated with TXRF measurements using Cu and Fe concentrations in different spiked and natural water samples as an example. The results showed that an uncertainty estimation based solely on the count statistics of the analyte is not a realistic estimation of the overall uncertainty, since the depositional repeatability and the relative sensitivity between the analyte and the internal standard are important contributions to the uncertainty budget. The uncertainty on the instrumental repeatability and sensitivity factor could be estimated and as such, potentially relatively straightforward implemented in the TXRF instrument software. However, the depositional repeatability varied significantly from sample to sample and between elemental ratios and the controlling factors are not well understood. By a lack of theoretical prediction of the depositional repeatability, the uncertainty budget can be based on repeat measurements using different reflectors. A simple approach to estimate the uncertainty was presented. The measurement procedure implemented and the uncertainty estimation processes developed were validated from the agreement with results obtained by inductively coupled plasma - optical emission spectrometry (ICP-OES) and/or reference/calculated values.

  9. ENERGY-DISPERSIVE, X-RAY REFLECTIVITY DENSITY MEASUREMENTS OF POROUS SIO2 XEROGELS

    EPA Science Inventory

    X-ray reflectivity has been used to nondestructively measure the density of thin, porous, SiO2-based xerogels. Critical angle, defined by total external reflection, was measured for multiple x-ray energies to correct for sample misalignment error in me determination of the densit...

  10. X-ray resonant reflection from magnetic multilayers: Recursion matrix algorithm

    SciTech Connect

    Stepanov, S. A.; Sinha, S. K.

    2000-06-01

    Recursion equations for 2x2 scattering matrices have been derived to calculate resonant x-ray reflection from magnetic multilayers. The solution has been basically reduced to that found in Stepanov et al, Phys. Rev. B 57, 4829 (1998) for grazing incidence x-ray diffraction from crystalline multilayers. (c) 2000 The American Physical Society.

  11. Measurements of reflectivity of x-ray mirror for Suzaku satellite

    NASA Astrophysics Data System (ADS)

    Tamura, Keisuke; Ogasaka, Yasushi; Naitou, Masataka; Maeda, Yoshitomo; Ebara, Masatoshi; Itoh, Akiharu; Iizuka, Ryo; Yokoyama, Yushi

    2006-06-01

    Detailed measurements of reflectivity of gold, which is used for X-ray mirror for X-ray telescope onboard "Suzaku" satellite was performed in the synchrotron radiation facility SPring-8 BL15XU. We measured reflectivity of the mirror, which uses total reflection of gold thin layer. Grazing incidence angle is 0.5 degree and incident X-ray monochromatized in the energy range from 2.2 keV to 3.5 keV, where M-edge structure of gold appears. We used double crystal monochrometer using Si(111) crystal, (ΔE/E ~ 10 -4) to monochromatize the incident X-ray. Energy calibration was performed using L-edge of molybdenum (2530.2 eV) and K-edge of argon (3205.9 eV). From the results, that the energy of M-V and M-IV edge of gold is different from optical constant table, and almost same as the value reported by Graessle et al.(1992).1 It is important to study the optical constants of gold or other mirror material for X-ray astronomy. This results will be feed back to the response function of the X-ray telescope of Suzaku satellite. It is very important for X-ray spectroscopy in X-ray astronomy.

  12. REFLECT: A computer program for the x-ray reflectivity of bent perfect crystals

    SciTech Connect

    Etelaeniemi, V.; Suortti, P.; Thomlinson, W. . Dept. of Physics; Brookhaven National Lab., Upton, NY )

    1989-09-01

    The design of monochromators for x-ray applications, using either standard laboratory sources on synchrotron radiation sources, requires a knowledge of the reflectivity of the crystals. The reflectivity depends on the crystals used, the geometry of the reflection, the energy range of the radiation, and, in the present case, the cylindrical bending radius of the optical device. This report is intended to allow the reader to become familiar with, and therefore use, a computer program called REFLECT which we have used in the design of a dual beam Laue monochromator for synchrotron angiography. The results of REFLECT have been compared to measured reflectivities for both bent Bragg and Laue geometries. The results are excellent and should give full confidence in the use of the program. 6 refs.

  13. Off-plane x-ray reflection grating fabrication

    NASA Astrophysics Data System (ADS)

    Peterson, Thomas J.; DeRoo, Casey T.; Marlowe, Hannah; McEntaffer, Randall L.; Miles, Drew M.; Tutt, James H.; Schultz, Ted B.

    2015-09-01

    Off-plane X-ray diffraction gratings with precision groove profiles at the submicron scale will be used in next generation X-ray spectrometers. Such gratings will be used on a current NASA suborbital rocket mission, the Off-plane Grating Rocket Experiment (OGRE), and have application for future grating missions. The fabrication of these gratings does not come without challenges. High performance off-plane gratings must be fabricated with precise radial grating patterns, optically at surfaces, and specific facet angles. Such gratings can be made using a series of common micro-fabrication techniques. The resulting process is highly customizable, making it useful for a variety of different mission architectures. In this paper, we detail the fabrication method used to produce high performance off-plane gratings and report the results of a preliminary qualification test of a grating fabricated in this manner. The grating was tested in the off-plane `Littrow' configuration, for which the grating is most efficient for a given diffraction order, and found to achieve 42% relative efficiency in the blaze order with respect to all diffracted light.

  14. Monte Carlo simulation applied in total reflection x-ray fluorescence: Preliminary results

    SciTech Connect

    Meira, Luiza L. C.; Inocente, Guilherme F.; Vieira, Leticia D.; Mesa, Joel

    2013-05-06

    The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities emitted by the elements of the sample, when properly excited. A variant of this technique is the Total Reflection X-ray Fluorescence (TXRF) that utilizes electromagnetic radiation as excitation source. In total reflection of X-ray, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample support interface. Thus, there is a minimum angle of incidence at which no refracted beam exists and all incident radiation undergoes total reflection. In this study, we evaluated the influence of the energy variation of the beam of incident x-rays, using the MCNPX code (Monte Carlo NParticle) based on Monte Carlo method.

  15. Ultra high throughput four-reflection x-ray telescope for high resolution spectroscopy

    NASA Astrophysics Data System (ADS)

    Tawara, Yuzuru; Mitsuishi, Ikuyuki; Babazaki, Yasunori; Nakamichi, Ren; Bandai, Ayako

    2015-09-01

    The first application of four-times reflection X-ray optics is planned for the DIOS mission, in which very soft X-ray observation is expected. On the other hand, effective area of the telescope for higher X-ray energy (E < 10 keV) including iron K emission lines has been so far limited to about 1000 cm2 for assumed several meter focal length. However, if we introduce four-reflection optics to this energy range, we can get several times large effective area for single telescope with same several meter focal length. To prove this possibility, we performed ray tracing simulation for four-reflection telescope with 6 m focal length and found that effective area of 3100 cm2 at 6 keV can be obtained for single telescope. In this paper, we will discuss about other telescope performances, mechanical properties and application to fine spectroscopic mission using X-ray micro-calorimeter.

  16. Molecular orientation in soft matter thin films studied by resonant soft X-ray reflectivity

    SciTech Connect

    Mezger, Markus; Jerome, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

    2011-01-12

    We present a technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. The method is based on dichroism in resonant soft X-ray reflectivity using linear s- and p-polarization. It combines the chemical sensitivity of Near-Edge X-ray Absorption Fine Structure spectroscopy to specific molecular bonds and their orientation relative to the polarization of the incident beam with the precise depth profiling capability of X-ray reflectivity. We demonstrate these capabilities on side chain liquid crystalline polymer thin films with soft X-ray reflectivity data at the carbon K edge. Optical constants of the anisotropic refractive index ellipsoid were obtained from a quantitative analysis using the Berreman formalism. For films up to 50 nm thickness we find that the degree of orientation of the long axis exhibits no depth variation and isindependent of the film thickness.

  17. Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

    NASA Astrophysics Data System (ADS)

    Singh, Surendra; Basu, Saibal

    2016-05-01

    X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

  18. Optimization of reflectivity of periodic and quasiperiodic multilayer films at soft X-ray wavelengths

    NASA Astrophysics Data System (ADS)

    Gu, E.; Marr, G. V.; Player, M. A.

    1990-06-01

    The reflectivity of multilayer films consisting of alternating layers of high and low refractive index is investigated. It is found that the thickness of periods affects the optimized reflectivity, and that a quasi-periodic structure with fixed thickness of periods but changing thicknesses of the layers can form two reflecting peaks at different wavelength positions. The result can be used to increase the bandwidth and to change the shape of reflectivity curves in the soft X-ray region. Since nonabsorbing material does not exist in the soft X-ray region, the thickness of each layer should be optimized separately in order to obtain maximum reflectivity at a single wavelength.

  19. A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity

    NASA Astrophysics Data System (ADS)

    Dai, Yeling; Lin, Binhua; Meron, Mati; Kim, Kyungil; Leahy, Brian; Shpyrko, Oleg G.

    2011-11-01

    Surface monolayers assembled on a liquid sub-phase represent a class of systems that is of great interest for studies of phase transitions in quasi-2D systems, chemical self-assembly, surfactant behavior, and biologically relevant monolayers and membranes. X-ray scattering is ideal for studying structural, dynamic, and mechanical properties of these surface monolayers at nanoscale due to the penetrating ability and short wavelength of x-rays. We show here that grazing incidence x-ray off-specular scattering (GIXOS) provides rapid access to in-plane and out-of-plane nanoscale structure, surface fluctuating modes, and potentially bending stiffness. We show that analysis of GIXOS data is highly sensitive to resolution effects. We further present detailed analysis of GIXOS from phospholipid 1,2-dipalmitoyl-phosphatidyl-choline C40H80NO8P (DPPC) and obtain quantitative, angstrom-resolution details of electron density profile normal to the surface that is comparable to those that are obtained from specular x-ray reflectivity measurements. We compare these GIXOS results to x-ray reflectivity measurements performed on the same samples. While electron density and main structural characteristics (such as monolayer thickness) obtained by GIXOS agree with x-ray reflectivity results, the interfaces of GIXOS-derived density profiles are found to be systematically sharper than those obtained with x-ray reflectivity. The possible reasons for these differences are discussed.

  20. Waiting in the Wings: Reflected X-ray Emission from the Homunculus Nebula

    NASA Technical Reports Server (NTRS)

    Corcoran, M. F.; Hamaguchi, K.; Gull, T.; Davidson, K.; Petre, R.; Hillier, D. J.; Smith, N.; Damineli, A.; Morse, J. A.; Walborn, N. R.

    2004-01-01

    We report the first detection of X-ray emission associated with the Homunculus Nebula which surrounds the supermassive star eta Carinae. The emission is characterized by a temperature in excess of 100 MK, and is consistent with scattering of the time-delayed X-ray flux associated with the star. The nebular emission is bright in the northwestern lobe and near the central regions of the Homunculus, and fainter in the southeastern lobe. We also report the detection of an unusually broad Fe K fluorescent line, which may indicate fluorescent scattering off the wind of a companion star or some other high velocity outflow. The X-ray Homunculus is the nearest member of the small class of Galactic X-ray reflection nebulae, and the only one in which both the emitting and reflecting sources are distinguishable.

  1. X-ray polaroids based on the total external reflection in anomalous-dispersion regions

    NASA Astrophysics Data System (ADS)

    Machavariani, V. Sh

    1996-12-01

    A new method of development of x-ray polaroids is suggested. The idea is based on the effect of total external reflection from an anisotropic crystal in the anomalous-dispersion region. The polarization coefficient for hexagonal BN crystal near the boron K absorption edge is calculated for different glancing angles and thicknesses of sample. It is shown that the method treated provides a simple way of constructing an effective x-ray polaroid.

  2. X-Ray Reflected Spectra from Accretion Disk Models. II. Diagnostic Tools for X-Ray Observations

    NASA Technical Reports Server (NTRS)

    Garcia, J.; Kallman, T. R.; Mushotzky, R. F.

    2011-01-01

    We present a comprehensive study of the emission spectra from accreting sources. We use our new reflection code to compute the reflected spectra from an accretion disk illuminated by X-rays. This set of models covers different values of ionization parameter, solar iron abundance and photon index for the illuminating spectrum. These models also include the most complete and recent atomic data for the inner-shell of the iron and oxygen isonuclear sequences. We concentrate our analysis to the 2 - 10 keV energy region, and in particular to the iron K-shell emission lines. We show the dependency of the equivalent width (EW) of the Fe Ka with the ionization parameter. The maximum value of the EW is approx. 800 eV for models with log Epsilon approx. 1.5, and decreases monotonically as Epsilon increases. For lower values of Epsilon the Fe K(alpha) EW decreases to a minimum near log Epsilon approx. 0.8. We produce simulated CCD observations based on our reflection models. For low ionized, reflection dominated cases, the 2 -10 keV energy region shows a very broad, curving continuum that cannot be represented by a simple power-law. We show that in addition to the Fe K-shell emission, there are other prominent features such as the Si and S L(alpha) lines, a blend of Ar VIII-XI lines, and the Ca x K(alpha) line. In some cases the S xv blends with the He-like Si RRC producing a broad feature that cannot be reproduced by a simple Gaussian profile. This could be used as a signature of reflection.

  3. A Global Look at Reflection in Black-Hole X-ray Binaries Using RXTE

    NASA Astrophysics Data System (ADS)

    Steiner, James F.; Garcia, Javier; Reis, Ruben C.; McClintock, Jeffrey E.

    2014-08-01

    Spectral reflection is ubiquitous in black-hole X-ray binaries, and is produced by the coronal hard X-ray emission illuminating the cooler accretion disk. The observed interplay between coronal and reflection spectral components provides insight into the geometry of the corona - an attribute which is presently only weakly constrained We present first results from a new campaign analyzing all RXTE PCU-2 spectra of accreting stellar-mass black holes. A simple but self-consistent treatment of disk, coronal, and reflection emission highlights changes evident in the coronal geometry between soft and hard spectral states.

  4. Seeing to the Event Horizon: Probing Accretion Physics with X-ray Reflection

    NASA Astrophysics Data System (ADS)

    Wilkins, Dan

    2015-09-01

    Accretion onto supermassive black holes in active galactic nuclei is known to power some of the most luminous objects we see in the Universe, which through their vast energy outputs must have played an important role in shaping the large scale structure of the Universe we see today. Much remains unknown, however, about the fine details of this process; exactly how energy is liberated from accretion flows onto black holes, how the 'corona' that produces the intense X-ray continuum is formed and what governs this process over time. I will outline how the detection of X-rays reflected from the discs of accreting material around black holes by the present generation of large X-ray observatories, shifted in energy and blurred by relativistic effects in the strong gravitational field close to the black hole, has enabled measurements of the inner regions of the accretion flow in unprecedented detail. In particular, exploiting the shift in energy of atomic emission lines by relativistic effects as a function of location on the disc has enabled the measurement of the illumination pattern of the accretion flow by the X-ray continuum from which the geometry of the emitting region can be inferred and how the detection of time lags between the primary and reflected X-rays owing to the additional path the reflected rays must travel between the corona and the disc places further constraints on the nature of the emitting corona. These techniques allow the evolution of the corona that accompanies transitions from high to low X-ray flux to be studied, giving clues to the physical process that forms and powers the intense X-ray source and uncovering evidence for the potential launching of jets. I will discuss the great steps forward in understanding accretion physics that can be made with the Athena X-ray observatory, combining detailed analysis of observations with predictions and models from general relativistic ray tracing simulations. In particular, I will discuss how high

  5. Doppler-shifted reflections of X rays in beamfoil spectroscopy

    NASA Technical Reports Server (NTRS)

    Bernstein, E. M.; Mcintyre, L. C., Jr.

    1976-01-01

    Carbon foils were positioned at roughly 10 deg to the conventional perpendicular position so that the spectrometer would view the beam on emergence from the foil, with no radiation shielded by a bowed or wrinkled foil or by the foil holder. Extraneous peaks due to reflected radiation were detected in the spectrum obtained with the tilted foil. A large satellite appears longward of the spectral line and is attributed to Doppler-shifted radiation reflected from the foil surface. Special tests arranged to validate the origin of the satellites are described. The relative intensity of the reflected radiation compared with the direct radiation observed is at variance with the relative intensities reported for longer wavelengths. The reasons for this, possible effects of spectrometer geometry, and applications in the investigation or generation of polarization remain to be investigated

  6. NASA's Chandra Finds That Saturn Reflects X-rays From Sun

    NASA Astrophysics Data System (ADS)

    2005-05-01

    When it comes to mysterious X-rays from Saturn, the ringed planet may act as a mirror, reflecting explosive activity from the sun, according to scientists using NASA's Chandra X-ray Observatory. The findings stem from the first observation of an X-ray flare reflected from Saturn's low-latitudes - the region that correlates to Earth's equator and tropics. Led by Dr. Anil Bhardwaj, a planetary scientist at NASA's Marshall Space Flight Center (MSFC) in Huntsville, Ala., the study revealed that Saturn acts as a diffuse mirror for solar X-rays. Counting photons - particles that carry electromagnetic energy including X-rays - was critical to this discovery. For every few thousand X-ray photons Saturn receives from the sun, it reflects a single X-ray photon back. Previous studies revealed that Jupiter, with a diameter 11 times that of Earth, behaves in a similar fashion. Saturn is about 9.5 times as big as Earth, but is twice as far from Earth as Jupiter. "The bigger the planet and nearer to the Sun, the more solar photons it will intercept - resulting in more reflected X-rays," said Bhardwaj. "These results imply we could use giant planets like Jupiter and Saturn as remote-sensing tools. By reflecting solar activity back to us, they could help us monitor X-ray flaring on portions of the sun facing away from Earth's space satellites." Massive solar explosions called flares often accompany coronal mass ejections, which emit solar material and magnetic field. When directed toward the Earth, these ejections can wreak havoc on communication systems from cell phones to satellites. Even as the research appears to have solved one mystery - the source of Saturn's X-rays, it fueled longstanding questions about magnetic fields. Earth's magnetic field is the reason compasses work, since the field acts like a huge bar magnet, causing the magnetic north pole of a compass to point to the magnetic south pole of the Earth. In addition, migratory birds seem to sense the magnetic field

  7. Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation.

    PubMed

    Kunimura, Shinsuke; Kawai, Jun

    2010-08-01

    Detection limits obtained by a portable total reflection X-ray fluorescence (TXRF) spectrometer with or without a monochromator are compared. A 1 W X-ray tube (tube voltage: 20 kV) is used in this spectrometer. Polychromatic excitation improves the detection limits in TXRF analysis with the low power X-ray tube compared with monochromatic excitation. A detection limit of 26 pg is achieved for Co when using the weak polychromatic X-rays. PMID:20535410

  8. X-ray reflection and scatter measurements on selected optical samples

    NASA Technical Reports Server (NTRS)

    Fields, S. A.; Reynolds, J. M.; Holland, R. L.

    1975-01-01

    The results from an experimental program to determine the reflection efficiency and scatter parameters of selected optical samples are presented. The measurements were made using 8.34A X-rays at various angles of incidence. Selected samples were contaminated after being measured and then remeasured to determine the effects of contamination. The instrumentation involved in taking the data, including the X-ray reflectometer and data processing equipment, is discussed in detail. The condition of the optical surfaces, the total reflection measurements, the scatter measurements, and the analysis are discussed.

  9. In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

    SciTech Connect

    Bertram, F. Evertsson, J.; Messing, M. E.; Mikkelsen, A.; Lundgren, E.; Zhang, F.; Pan, J.; Carlà, F.; Nilsson, J.-O.

    2014-07-21

    We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.

  10. In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

    NASA Astrophysics Data System (ADS)

    Bertram, F.; Zhang, F.; Evertsson, J.; Carlà, F.; Pan, J.; Messing, M. E.; Mikkelsen, A.; Nilsson, J.-O.; Lundgren, E.

    2014-07-01

    We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.

  11. Portable total reflection x-ray fluorescence analysis in the identification of unknown laboratory hazards

    SciTech Connect

    Liu, Ying Imashuku, Susumu; Sasaki, Nobuharu; Ze, Long; Kawai, Jun; Takano, Shotaro; Sohrin, Yoshiki; Seki, Hiroko; Miyauchi, Hiroya

    2014-05-15

    In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient to determine all the elements (Z > 11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.

  12. Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance

    NASA Astrophysics Data System (ADS)

    Burcklen, C.; Soufli, R.; Dennetiere, D.; Polack, F.; Capitanio, B.; Gullikson, E.; Meltchakov, E.; Thomasset, M.; Jérome, A.; de Rossi, S.; Delmotte, F.

    2016-03-01

    We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B4C-on-Cr interface, which we modeled with a 1-1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L2,3 absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.

  13. Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance

    DOE PAGESBeta

    Burcklen, C.; Soufli, R.; Gullikson, E.; Meltchakov, E.; Dennetiere, D.; Polack, F.; Capitanio, B.; Thomasset, M.; Jerome, A.; de Rossi, S.; et al

    2016-03-24

    Here, we present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B4C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L2,3 absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (opticalmore » constants) values for Cr.« less

  14. A model for testing strong gravity via X-ray reflection spectroscopy

    NASA Astrophysics Data System (ADS)

    Bambi, Cosimo; Nampalliwar, Sourabh; Cardenas-Avendano, Alejandro

    2016-07-01

    Astrophysical black hole candidates are thought to be the Kerr black holes of general relativity. However, a direct observational evidence is still lacking. The X-ray radiation produced in the inner part of the accretion disk can be a powerful tool to test the Kerr nature of these objects. In this talk, we present a new model for testing the Kerr black hole hypothesis via X-ray reflection spectroscopy. We employ the formalism of the transfer function proposed by Cunningham 40 years ago. The transfer function acts as an integration kernel and takes into account all the relativistic effects. We have developed a code to compute transfer functions in arbitrary stationary and axisymmetric spacetimes. These transfer functions are tabulated in FITS files and combined with XILLVER. The result is best model that we can have today for testing black hole candidates via X-ray reflection spectroscopy.

  15. Active membranes studied by X-ray scattering.

    PubMed

    Giahi, A; El Alaoui Faris, M; Bassereau, P; Salditt, T

    2007-08-01

    In view of recent theories of "active" membranes, we have studied multilamellar phospholipid membrane stacks with reconstituted transmembrane protein bacteriorhodopsin (BR) under different illumination conditions by X-ray scattering. The light-active protein is considered as an active constituent which drives the system out of equilibrium and is predicted to change the collective fluctuation properties of the membranes. Using X-ray reflectivity, X-ray non-specular (diffuse) scattering, and grazing incidence scattering, we find no detectable change in the scattering curves when changing the illumination condition. In particular the intermembrane spacing d remains constant, after eliminating hydration-related artifacts by design of a suitable sample environment. The absence of any observable non-equilibrium effects in the experimental window is discussed in view of the relevant parameters and recent theories. PMID:17712523

  16. Direct and quantitative comparison of pixelated density profiles to high resolution X-ray reflectivity data.

    SciTech Connect

    Fenter, Paul; Lee, S. S.; Skelton, A A; Cummings, Peter T

    2011-01-01

    A method for comparing pixelated density profiles (e.g. obtained from molecular dynamics or other computational techniques) with experimental X-ray reflectivity data both directly and quantitatively is described. The conditions under which such a comparison can be made quantitatively (e.g. with errors <1%) are determined theoretically by comparing calculated structure factors for an intrinsic continuous density profile with those obtained from density profiles that have been binned into regular spatial increments. The accuracy of the X-ray reflectivity calculations for binned density profiles is defined in terms of the inter-relationships between resolution of the X-ray reflectivity data (i.e. its range in momentum transfer), the chosen bin size and the width of the intrinsic density profile. These factors play a similar role in the application of any structure-factor calculations that involve the use of pixelated density profiles, such as those obtained from iterative phasing algorithms for inverting structures from X-ray reflectivity and coherent diffraction imaging data. Finally, it is shown how simulations of a quartz water interface can be embedded into an exact description of the bulk phases (including the substrate crystal and the fluid water, below and above the actual interface) to quantitatively reproduce the experimental reflectivity data of a solid liquid interface.

  17. Testing the Pairs-Reflection Model with X-Ray Spectral Variability and X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects

    NASA Astrophysics Data System (ADS)

    Urry, C. Megan

    1997-01-01

    This grant was awarded to Dr. C. Megan Urry of the Space Telescope Science Institute in response to two successful ADP proposals to use archival Ginga and Rosat X-ray data for 'Testing the Pairs-Reflection model with X-Ray Spectral Variability' (in collaboration with Paola Grandi, now at the University of Rome) and 'X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects' (in collaboration with then-graduate student Rita Sambruna, now a post-doc at Goddard Space Flight Center). In addition, post-docs Joseph Pesce and Elena Pian, and graduate student Matthew O'Dowd, have worked on several aspects of these projects. The grant was originally awarded on 3/01/94; this report covers the full period, through May 1997. We have completed our project on the X-ray properties of radio-selected BL Lacs.

  18. Total reflection X-ray photoelectron spectroscopy as a semiconductor lubricant elemental analysis method

    NASA Astrophysics Data System (ADS)

    Alshehabi, Abbas; Sasaki, Nobuharu; Kawai, Jun

    2015-12-01

    Photoelectron spectra from a typical hard disk storage media device (HDD) were measured at total reflection and non-total reflection at unburnished, acetone-cleaned, and argon-sputtered conditions. F, O, N, and C usually making the upper layer of a typical hard disk medium were detected. Enhancement of the photoelectron emission of the fluorocarbon lubricant was observed at total reflection. Pt and Co were only found by non-total X-ray photoelectron spectroscopy (XPS) because they are constituents of a deeper region than the top and interface regions. Argon-sputtered, ultrasonic acetone-cleaned, and unburnished top layers were compared at total and non-total reflection conditions. Total reflection X-ray photoelectron spectroscopy (TRXPS) is demonstrated to be a powerful tool for storage media lubrication layer chemical state analysis, reliable for industrial quality control application , and reproducible.

  19. Interaction between Lipid Monolayers and Poloxamer 188: An X-Ray Reflectivity and Diffraction Study

    PubMed Central

    Wu, Guohui; Majewski, Jaroslaw; Ege, Canay; Kjaer, Kristian; Weygand, Markus Jan; Lee, Ka Yee C.

    2005-01-01

    The mechanism by which poloxamer 188 (P188) seals a damaged cell membrane is examined using the lipid monolayer as a model system. X-ray reflectivity and grazing-incidence x-ray diffraction results show that at low nominal lipid density, P188, by physically occupying the available area and phase separating from the lipids, forces the lipid molecules to pack tightly and restore the barrier function of the membrane. Upon compression to bilayer equivalent pressure, P188 is squeezed out from the lipid monolayer, allowing a graceful exit of P188 when the membrane integrity is restored. PMID:16100276

  20. Critical Reexamination of Resonant Soft X-Ray Bragg Forbidden Reflections in Magnetite

    SciTech Connect

    Wilkins, S.B.; Di Matteo, S.; Beale, T.A.W.; Joly, Y.; Mazzoli, C.; Hatton, P.D.; Bencok, P.; Yakhou, F.; Brabers, V.A.M.

    2009-05-01

    Magnetite, Fe{sub 3}O{sub 4}, displays a highly complex low-temperature crystal structure that may be charge and orbitally ordered. Many of the recent experimental claims of such ordering rely on resonant soft x-ray diffraction at the oxygen K and iron L edges. We have reexamined this system and undertaken soft x-ray diffraction experiments on a high-quality single crystal. Contrary to previous claims in the literature, we show that the intensity observed at the Bragg forbidden (001/2){sub c} reflection can be explained purely in terms of the low-temperature structural displacements around the resonant atoms. This does not necessarily mean that magnetite is not charge or orbitally ordered but rather that the present sensitivity of resonant soft x-ray experiments does not allow conclusive demonstration of such ordering.

  1. [Technology Development for X-Ray Reflection for the Constellation-X Reflection Grating Spectrometer (RGS)

    NASA Technical Reports Server (NTRS)

    Schattenburg, Mark L.

    2003-01-01

    This Grant covers MIT support for the technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we successfully developed several nanoimprint grating replication methods that achieved very high fidelity replication of master silicon gratings. Grating geometry on the nano and macro scales were faithfully replicated, demonstrating the viability of the process for manufacturing the thousands of gratings required for the RGS. We also successfully developed an improved metrology truss for holding test grating substrates during metrology. The flatness goal of grating substrates is under 500 nm. In the past, grating holders would cause non-repeatable distortion of >> 500 nm to the substrates due to friction and gravity sag. The new holder has a repeatability of under 50 nm which is adequate for the proposed RGS grating substrates.

  2. Characterization of ion beam sputtered deposited W/Si multilayers by grazing incidence x-ray diffraction and x-ray reflectivity technique

    NASA Astrophysics Data System (ADS)

    Dhawan, Rajnish; Rai, Sanjay

    2016-05-01

    W/Si multilayers four samples have been deposited on silicon substrate using ion beam sputtering system. Thickness of tungsten (W) varies from around 10 Å to 40 Å while the silicon (Si) thickness remains constant at around 30 Å in multilayers [W-Si]x4. The samples have been characterized by grazing incidence X-ray diffraction (GIXRD) and X-ray reflectivity technique (XRR). GIXRD study shows the crystalline behaviour of W/Si multilayer by varying W thickness and it is found that above 20 Å the W film transform from amorphous to crystalline phase and X-ray reflectivity data shows that the roughnesses of W increases on increasing the W thicknesses in W/Si multilayers.

  3. Understanding X-ray Reflection as a Probe of Accreting Black Holes

    NASA Astrophysics Data System (ADS)

    Wilkins, Dan

    2014-01-01

    Active galactic nuclei (AGN) are some of the most luminous objects we see in the Universe, powered by the accretion of matter onto a supermassive black hole in the centre of a galaxy, yet many of the physical processes by which the energy is released and injected into the surroundings remain a mystery. X-rays are emitted from a ‘corona’ of energetic particles surrounding the black hole and as well as being observed directly, they are seen to be reflected from the accreting disc, producing a number of spectral features including emission lines that are broadened by relativistic effects in the proximity of the black hole. In my thesis, I develop methods through which detailed measurement of the reflected X-rays from the accretion disc can be used to probe the innermost regions of accretion flow and corona, right down to the innermost stable orbit and the event horizon. Novel spectral analysis techniques allow us to reconstruct, from the observed relativistic X-ray reflection spectrum the spatially resolved illumination pattern of the accretion disc and will discuss how comparing this to the results of systematic general relativistic ray tracing simulations I have developed, we are able to constrain the location and geometry of the X-ray emitting corona and understand the dramatic change of the narrow line Seyfert 1 galaxy 1H 0707-495 into an extremely low flux state in terms of a collapse in the corona. I will discuss how measurements of the X-ray variability, specifically the reverberation time lags that are observed between variability in the directly observed X-rays from the corona and those reflected from the accretion disc add a further dimension to the study of accreting black holes, letting us not only build up a three dimensional image of the immediate vicinity of the black hole but also to probe mechanisms by which the energy is released from the accretion flow; techniques that will let us exploit not just current instrumentation but future proposed X-ray

  4. Optimization of the reflecting coatings for the new hard x-ray mission

    NASA Astrophysics Data System (ADS)

    Cotroneo, V.; Pareschi, G.; Spiga, D.; Tagliaferri, G.

    2009-08-01

    The design of the next generation of hard-X-ray focusing telescopes requires highly optimized reflecting coatings, with the maximum efficiency over a broad energy band and a relatively large field of view. Multilayer coatings based on layer thicknesses with power-law distribution are often considered as a convenient solution to achieve angular and energetic broad band reflection of X-ray at grazing incidence, being also particularly suitable for numerical optimization. In this work we consider the optimization of the telescope for the New Hard X-ray Mission, an Italian project based on four optical modules with multilayer-coated Nickel-replicated Wolter optics, able to focus high-energy X-ray radiation (up to 80 keV) with good imaging resolution (20 arcsec HEW). The optimization of the telescope was studied from the point of view of shell sizes, coating materials and multilayer structures. In particular, the best structure of the coating is determined by means of numerical optimization methods introducing also the number of layers as optimization parameters. Very effective solutions are found even with a low number of bilayers (~100).

  5. Self-consistent approach to x-ray reflection from rough surfaces

    SciTech Connect

    Feranchuk, I. D.; Feranchuk, S. I.; Ulyanenkov, A. P.

    2007-02-15

    A self-consistent analytical approach for specular x-ray reflection from interfaces with transition layers [I. D. Feranchuk et al., Phys. Rev. B 67, 235417 (2003)] based on the distorted-wave Born approximation (DWBA) is used for the description of coherent and incoherent x-ray scattering from rough surfaces and interfaces. This approach takes into account the transformation of the modeling transition layer profile at the interface, which is caused by roughness correlations. The reflection coefficients for each DWBA order are directly calculated without phenomenological assumptions on their exponential decay at large scattering angles. Various regions of scattering angles are discussed, which show qualitatively different dependence of the reflection coefficient on the scattering angle. The experimental data are analyzed using the method developed.

  6. Structure of Magainin and Alamethicin in Model Membranes Studied by X-Ray Reflectivity

    PubMed Central

    Li, C.; Salditt, T.

    2006-01-01

    We have investigated the structure of lipid bilayers containing varied molar ratios of different lipids and the antimicrobial peptides magainin and alamethicin. For this structural study, we have used x-ray reflectivity on highly aligned solid-supported multilamellar lipid membranes. The reflectivity curves have been analyzed by semi-kinematical reflectivity theory modeling the bilayer density profile ρ(z). Model simulations of the reflectivity curves cover a large range of vertical momentum transfer qz, and yield excellent agreement between data and theory. The structural changes observed as a function of the molar peptide/lipid concentration P/L are discussed in a comparative way. PMID:16920839

  7. MILO, a mirror reflectivity code for low-energy x-rays

    SciTech Connect

    Kissel, L.

    1982-09-01

    MILO (MIrror reflectivity code, LOw energy) is an interactive fault-tolerant user-oriented code which calculates low-energy x-ray mirror reflectivity. The code combines user input with previously calculated, complex, atomic scattering factors to produce the unpolarized mirror reflectivity at various values of mirror angle and photon energy. The code can calculate the reflectivity of mirrors composed of pure elements and of homogeneous mixtures of elements. MILO is written in standard, high-machine-independent, FORTRAN 77 (ANSI X3.9-1978).

  8. A disc-reflected component in the spectra of X-ray bursters

    NASA Technical Reports Server (NTRS)

    Day, C. S. R.; Done, C.

    1991-01-01

    An argument is presented to the effect that a disk-reflected component should be present in the spectra of X-ray bursts and is best seen just after the burst peak when the reflected photons, delayed by their passage to the site of reflection, appear in stronger contrast to the fast-declining primary emission from the cooling neutron star. It is shown that disk reflection has an observable effect on the spectrum of the burst tail. The possible use of the concomitant absorption edge as a diagnostic of the accretion disk is discussed.

  9. The x ray reflectivity of the AXAF VETA-I optics

    NASA Technical Reports Server (NTRS)

    Kellogg, Edwin M.; Chartas, G.; Graessle, D.; Hughes, John P.; Vanspeybroeck, Leon; Zhao, Ping; Weisskopf, M. C.; Elsner, R. F.; Odell, S. L.

    1992-01-01

    The x-ray reflectivity of the VETA-I optic, the outermost shell of the AXAF x-ray telescope, with a bare Zerodur surface, is measured and compared with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. The data were obtained at the x-ray calibrations facility at Marshall Space Flight Center with an electron impact x-ray source located 528 m from the grazing incidence mirror. The source used photoelectric absorption filters to eliminate bremsstrahlung continuum. The mirror has a diameter of 1.2 m and a focal length of 10 m. The incident and reflected x-ray flux are detected using two proportional counters, one located in the incident beam of x-rays at the entrance aperture of the VETA-I, and the other in the focal plane behind an aperture of variable size. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. We also present a synchrotron reflectivity measurement with high energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample, done at NSLS. We present evidence for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 percent and 10 percent, depending on which model for the surface composition is adopted. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff. We also discuss the approach to the final preflight calibration of the full AXAF flight mirror.

  10. X-ray reflectivity study of GMR and porous silicon thin layers

    NASA Astrophysics Data System (ADS)

    Asgharizadeh, Saeid

    X-ray scattering is an ideal technique to perform measurements on the structures of materials. In the present thesis we use x-ray reflectivity (XRR) to study the structural properties of layers and multilayers. A trilayer system of CoFe-Ru-CoFe used for spin valve multilayers is investigated and the changes in structural properties induced by different procedures such as changing the Ru spacer layer, oxidation of the Ru spacer layer and annealing the sample are studied. Also, we study the electron density, thickness and optical index of refraction of samples prepared by glancing angle deposition (GLAD) method. We investigate the porosity in these samples by XRR technique. We use a method to calculate the reflectivity for any given density profile by dividing it into N-step layers. In this model, a continuous function describes the density profile in the interfaces. Two different types of graded and rough interfaces are introduced and their effect on the x-ray diffuse scattering is discussed. We use a method of x-ray specular data collection that separates the diffuse scattering from the specular. The computer programs are written in the Yorick interpreted language based on specular and diffuse x-ray scattering models to fit the data using a non-linear least squares fitting method. By fitting the XRR data of CoFe-Ru-CoFe trilayers, it is revealed that the increasing thickness of the Ru spacer layer decreases the sheet resistivity of the sample. While, the oxidation of the spacer layer leads to an increase in the sheet resistivity. The electron density profile of the GLAD samples are investigated and a linear density profile is concluded. The slope of this linear density profiles turns out to be an angle of deposition dependent parameter. These profiles, also, reveal that the porosity of the GLAD samples increases with increasing the deposition angle.

  11. Perspectives and limitations of symmetric X-ray Bragg reflections for inspecting polytypism in nanowires.

    PubMed

    Köhl, Martin; Schroth, Philipp; Baumbach, Tilo

    2016-03-01

    X-ray diffraction, possibly time-resolved during growth or annealing, is an important technique for the investigation of polytypism in free-standing nanowires. A major advantage of the X-ray diffraction approach for adequately chosen beam conditions is its high statistical significance in comparison with transmission electron microscopy. In this manuscript the interpretation of such X-ray intensity distribution is discussed, and is shown to be non-trivial and non-unique given measurements of the [111]c or [333]c reflection of polytypic nanowires grown in the (111)c direction. In particular, the diffracted intensity distributions for several statistical distributions of the polytypes inside the nanowires are simulated and compared. As an example, polytypic GaAs nanowires are employed, grown on a Si-(111) substrate with an interplanar spacing of the Ga (or As) planes in the wurtzite arrangement that is 0.7% larger than in the zinc blende arrangement along the (111)c direction. Most importantly, ambiguities of high experimental relevance in the case of strongly fluctuating length of the defect-free polytype segments in the nanowires are demonstrated. As a consequence of these ambiguities, a large set of deviations from the widely used Markov model for the stacking sequences of the nanowires cannot be detected in the X-ray diffraction data. Thus, the results here are of high relevance for the proper interpretation of such data. PMID:26917137

  12. Application of the Total Reflection X-ray Fluorescence technique to trace elements determination in tobacco

    NASA Astrophysics Data System (ADS)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2008-12-01

    Many studies have identified an important number of toxic elements along with organic carcinogen molecules and radioactive isotopes in tobacco. In this work we have analyzed by Total Reflection X-Ray Fluorescence 9 brands of cigarettes being manufactured and distributed in the Mexican market. Two National Institute of Standards and Technology standards and a blank were equally treated at the same time. Results show the presence of some toxic elements such as Pb and Ni. These results are compared with available data for some foreign brands, while their implications for health are discussed. It can be confirmed that the Total Reflection X-Ray Fluorescence method provides precise (reproducible) and accuracy (trueness) data for 15 elements concentration in tobacco samples.

  13. Protein Folding at the Air-Water Interface Studied with X-Ray Reflectivity

    NASA Astrophysics Data System (ADS)

    Gidalevitz, David; Huang, Zhengqing; Rice, Stuart A.

    1999-03-01

    We report the results of x-ray reflectivity measurements of thin films formed by different water-soluble proteins at the air-aqueous solution interface. It is demonstrated that glucose oxidase, alcohol dehydrogenase, and urease molecules denaturate at the air-aqueous solution interface to form 8- to 14- angstrom -thick peptide sheets. X-ray reflectivity data indicate that the spreading of a lipid monolayer at the aqueous solution surface before protein injection does not prevent proteins from unfolding. On the other hand, crosslinking of proteins results in intact enzyme layers at the subphase surface. A model that involves interaction of glucose oxidase molecules with a phospholipid monolayer is proposed. In this model, an observed decrease of the lipid electron density in the protein presence is explained in terms of "holes" in the monolayer film caused by protein molecule adsorption.

  14. Resonant x-ray reflectivity study of partial decomposed boron nitride thin films using Indus-1 synchrotron

    SciTech Connect

    Nayak, Maheswar Lodha, Gyanendra S.

    2014-04-24

    We determined the microstructural parameters and chemical composition profile of partial decomposed boron nitride thin films using x-ray reflectivity near the respective absorption edges. The elemental specificity and optical contrast variation properties of the resonant effect are utilized to combine chemical analysis with physical microstructure of thin films from x-ray scattered intensities. We demonstrated these aspects through calculations and experiments in the soft x-ray region near the boron K-absorption edge.

  15. X-ray reflection from cold matter in the nuclei of active galaxies

    NASA Astrophysics Data System (ADS)

    Pounds, K. A.; Nandra, K.; Stewart, G. C.; George, I. M.; Fabian, A. C.

    1990-03-01

    The discovery of continuum absorption and reflection in a composite spectrum from 12 Ginga observations of Seyfert-type AGN is reported. Most of these spectral features are shown to be well-modeled by reprocessing of hard X-ray power-law continuum in a slab (or perhaps a disk) of cold matter. There is also evidence for a substantial line-of-sight column of photoionized material.

  16. Illumination of Cation Sorption Mechanisms on Muscovite Using X-ray Reflectivity

    NASA Astrophysics Data System (ADS)

    Nagy, K. L.; Schlegel, M. L.; Fenter, P.; Jacobsen, S. D.; Sturchio, N. C.; Cheng, L.

    2002-12-01

    Detrital phyllosilicates and clays are major sorbents for contaminants, natural organic matter, and nutrients in soils and sediments, yet our knowledge of sorption mechanisms is largely based on data obtained at the macroscopic scale. Synchrotron-based X-ray reflectivity is used to determine the structure of sorbates with respect to the mineral surface and, in contrast to X-ray Absorption Spectroscopic techniques, provides comparable information concerning the distribution of water. The unique ability to characterize water structure illuminates the inner-sphere or outer-sphere nature of sorbed cations. We used high-resolution in-situ X-ray reflectivity measurements at BESSRC-CAT, Advanced Photon Source, to characterize the sorption of K, Cs, Ca, and Ba from chloride solutions onto the basal surface of muscovite. X-ray reflectivity data were collected through the specular reflection condition and converted to electron density profiles perpendicular to the interface by applying atomistic structural models that included surface relaxation, sorbate concentration and position, water structure, and surface roughness. Cations were attached to the basal surface dominantly in the first adsorbed layer, which has the highest electron density of the solution phase. Derived heights above basal oxygens for K (1.67(6) \\x8F) and Cs (2.15(9) \\x8F) differ by the difference in their crystallographic radii and correspond closely to values in bulk K- and Cs-micas. Heights for Ca (2.5(1) \\x8F) and Ba (2.04(5) \\x8F) follow the trend for hydrated radii and deviate from the trend for crystallographic radii. All derived heights imply that no separate water layer exists between the sorbates and mineral surface. Interpretations of electron density profiles indicate the presence of cosorbed water or possibly, for divalent cations, cosorbed chloride. Water layering above the sorbed cation layer and minimal relaxation of the bulk muscovite were observed.

  17. Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation.

    PubMed

    Beckhoff, Burkhard; Fliegauf, Rolf; Kolbe, Michael; Müller, Matthias; Weser, Jan; Ulm, Gerhard

    2007-10-15

    Total reflection X-ray fluorescence (TXRF) analysis is a well-established method to monitor lowest level contamination on semiconductor surfaces. Even light elements on a wafer surface can be excited effectively when using high-flux synchrotron radiation in the soft X-ray range. To meet current industrial requirements in nondestructive semiconductor analysis, the Physikalisch-Technische Bundesanstalt (PTB) operates dedicated instrumentation for analyzing light element contamination on wafer pieces as well as on 200- and 300-mm silicon wafer surfaces. This instrumentation is also suited for grazing incidence X-ray fluorescence analysis and conventional energy-dispersive X-ray fluorescence analysis of buried and surface nanolayered structures, respectively. The most prominent features are a high-vacuum load-lock combined with an equipment front end module and a UHV irradiation chamber with an electrostatic chuck mounted on an eight-axis manipulator. Here, the entire surface of a 200- or a 300-mm wafer can be scanned by monochromatized radiation provided by the plane grating monochromator beamline for undulator radiation in the PTB laboratory at the electron storage ring BESSY II. This beamline provides high spectral purity and high photon flux in the range of 0.078-1.86 keV. In addition, absolutely calibrated photodiodes and Si(Li) detectors are used to monitor the exciting radiant power respectively the fluorescence radiation. Furthermore, the footprint of the excitation radiation at the wafer surface is well-known due to beam profile recordings by a CCD during special operation conditions at BESSY II that allow for drastically reduced electron beam currents. Thus, all the requirements of completely reference-free quantitation of TXRF analysis are fulfilled and are to be presented in the present work. The perspectives to arrange for reference-free quantitation using X-ray tube-based, table-top TXRF analysis are also addressed. PMID:17880182

  18. A Spectral Variability Survey of X-ray Reflection and Absorption in Seyfert AGN using the Rossi X-ray Timing Explorer Database

    NASA Astrophysics Data System (ADS)

    Markowitz, Alex

    The Rossi X-ray Timing Explorer (RXTE) is the current longest-running X-ray mission. It has collected data on over 130 Active Galactic Nuclei (AGN) over its 15-year lifetime. We plan to systematically analyze the broad X-ray spectra of all AGN observed with RXTE to produce the ultimate and complete spectral sample with which to solidify the legacy of RXTE towards AGN science and towards understanding the nature of reprocessing and reflection processes in Seyferts. In many cases, RXTE conducted sustained monitoring spanning a baseline of many years, so our proposed time-averaged spectral analysis reduces the ambiguity inherent in individual snapshots due to source variability, thereby providing the community with long-term average X-ray spectral properties as well as identifying any state changes in sources. We will also perform time- and flux-resolved spectroscopy to search for variability in the Fe K alpha emission line in response to X-ray continuum flux variations to constrain its location via reverberation mapping, e.g., material commensurate with the optical Broad Line Region or a parsec- scale torus. Our proposed work will place important constraints on the location and homogeneity of the Compton-thick circumnuclear accreting gas. We will also search for variations in the line-of-sight column density of absorbing material in Seyferts to test classical Seyfert 1/2 unification schemes against newer models which rely on distributions of clumps of gas and for which X-ray absorption is a viewing-angle dependent probability, and provide observational constraints for these latter models. This research supports NASA Strategic Goal 2 by expanding scientific understanding of the universe in which we live, how the universe works, and how the observable universe came to be.

  19. THIN-FILM DENSITY DETERMINATION OF TANTALUM, TANTALUM OXIDES, AND XEROGELS BY MULTIPLE RADIATION ENERGY DISPERSIVE X-RAY REFLECTIVITY

    EPA Science Inventory

    X-ray reflectivity provides a nondestructive technique for measuring density in thin films. A conventional laboratory, Bragg-Brentano geometry diffractometer was employed to show the generalized feasibility of this technique. X-ray tubes with chromium, copper, and molybdenum targ...

  20. RASOR: an advanced instrument for soft x-ray reflectivity and diffraction.

    PubMed

    Beale, T A W; Hase, T P A; Iida, T; Endo, K; Steadman, P; Marshall, A R; Dhesi, S S; van der Laan, G; Hatton, P D

    2010-07-01

    We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument. PMID:20687739

  1. Search for astrophysical rotating Ellis wormholes with x-ray reflection spectroscopy

    NASA Astrophysics Data System (ADS)

    Zhou, Menglei; Cardenas-Avendano, Alejandro; Bambi, Cosimo; Kleihaus, Burkhard; Kunz, Jutta

    2016-07-01

    Recently, two of us have found numerically rotating Ellis wormholes as solutions of four-dimensional Einstein gravity coupled to a phantom field. In this paper, we investigate possible observational signatures to identify similar objects in the Universe. These symmetric wormholes have a mass and are compact, so they may look like black holes. We study the iron line profile in the x-ray reflection spectrum of a thin accretion disk around rotating Ellis wormholes and we find some specific observational signatures that can be used to distinguish these objects from Kerr black holes. We simulate some observations with XIS/Suzaku assuming typical parameters for a bright active galactic nucleus and we conclude that current x-ray missions cannot apply strong constraints.

  2. Total reflection x-ray fluorescence: Determination of an optimum geometry

    SciTech Connect

    Koo, Y.M.; Chang, C.H.; Padmore, H.A.

    1997-04-01

    Total reflection X-Ray Fluorescence (TXRF) is a widely used technique in which the normal trace element detection capability of hard x-ray fluorescence (XRF) is enhanced by use of an x-ray reflective substrate. TXRF is more sensitive than normal photon induced XRF due to the reduction of the substrate scattering and fluorescence signals. This reduction comes about because in total external reflection, the photon field only penetrates about 20 {angstrom} into the surface, instead of typically 50 {mu}m for a silicon substrate at normal incidence for 10 KeV photons. The technique is used in many fields of trace element analysis, and is widely used in the determination of metal impurity concentrations on and in the surface of silicon wafers. The Semiconductor Industry Association roadmap (SIA) indicates a need for wafer contamination detection at the 10{sup 7}atoms/cm{sup 2} level in the next few years. Current commercial systems using rotating anode x-ray sources presently routinely operate with a sensitivity level of around 10{sup 10} atoms/cm{sup 2} and this has led to interest in the use of synchrotron radiation to extend the sensitivity by three orders of magnitude. The pioneering work of Pianetta and co-workers at SSRL has clearly shown that this should be possible, using a fully optimized source and detector. The purpose of this work is to determine whether ALS would be a suitable source for this type of highly sensitive wafer TXRF. At first look it appears improbable as the SSRL work used a high flux multipole wiggler source, and it is clear that the detected fluorescence for relevant concentrations is small. In addition, SSRL operates at 3.0 GeV rather than 1.9 GeV, and is therefore more naturally suited to hard x-ray experiments. The aim of this work was therefore to establish a theoretical model for the scattering and fluorescence processes, so that one could predict the differences between alternative geometries and select an optimum configuration.

  3. Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2.

    PubMed

    Das, Gangadhar; Kane, S R; Khooha, Ajay; Singh, A K; Tiwari, M K

    2015-05-01

    A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazing incidence fluorescence on a single reflectometer. PMID:26026553

  4. Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2

    SciTech Connect

    Das, Gangadhar; Kane, S. R.; Khooha, Ajay; Singh, A. K.; Tiwari, M. K.

    2015-05-15

    A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazing incidence fluorescence on a single reflectometer.

  5. Total reflection X-ray fluorescence spectrometers for multielement analysis: status of equipment

    NASA Astrophysics Data System (ADS)

    Ayala Jiménez, Rony E.

    2001-11-01

    Multielement analysis by total reflection X-ray fluorescence spectrometry has evolved during two decades. At present commercial equipment is available for chemical analysis of all types of biological and mineral samples. The electronic industry has also benefited from scientific and technological developments in this field due to new instrumentation to determine contamination on the surface of silicon wafers (the equipment will not be covered in this paper). The basic components of the spectrometers can be summarized as follows: (a) excitation source; (b) geometric arrangement (optics) for collimation and monochromatization of the primary radiation; (c) X-ray detector; and (d) software for operation of the instrument, data acquisition and spectral deconvolution to determine the concentrations of the elements (quantitative analysis). As an optional feature one manufacturer offers a conventional 45° geometry for direct excitation. Personal communications of the author and commercial brochures available have allowed us to list the components used in TXRF for multielement analysis. Excitation source: high-power sealed X-ray tubes, output from 1300 to 3000 W, different mixed alloy anodes Mo/W are used but molybdenum, tungsten and copper are common; single anode metal ceramic low power X-ray tubes, output up to 40 W. Excitation systems can be customized according to the requirements of the laboratory. Detector: silicon-lithium drifted semiconductor detector liquid nitrogen cooled; or silicon solid state thermoelectrically cooled detector (silicon drift detector SDD and silicon-PIN diode detector). Optics: multilayer monochromator of silicon-tungsten, nickel-carbon or double multilayer monochromator. Electronics: spectroscopy amplifier, analog to digital converter adapted to a PC compatible computer with software in a Windows environment for the whole operation of the spectrometer and for qualitative/quantitative analysis of samples are standard features in the

  6. Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples

    NASA Astrophysics Data System (ADS)

    Clark, Anna M.; Bruni, Ricardo J.; Romaine, Suzanne E.; Schwartz, Daniel A.; van Speybroeck, Leon P.; Yip, P. W.; Drehman, A. J.; Shapiro, Alan P.

    1996-07-01

    One of the specifications used to polish the AXAF witness samples was that the rms surface roughness be x-ray reflectivity of the surfaces. In particular, the reflectivity data from the AXAF flight optic witness samples indicate sample to sample differences of a few percent which do not correlate with the optical profilometry results for these samples. Further investigations were carried out to measure rms surface roughness using atomic force microscopy (AFM). The differences shown by AFM surface roughness measurements correlates to differences found in reflectivity for these same samples. One-dimensional power spectral density data is presented from both AFM and WYKO measurements along with the reflectivity results at 8 keV for the AXAF witness samples. The results indicate that to obtain accurate prediction of x-ray performance it is necessary to look at the scanning probe metrology data provided by the AFM, in addition to the optical profilometry data.

  7. Synchrotron total reflection X-ray fluorescence at BL-16 microfocus beamline of Indus-2

    NASA Astrophysics Data System (ADS)

    Tiwari, M. K.; Singh, A. K.; Das, Gangadhar; Chowdhury, Anupam; Lodha, G. S.

    2014-04-01

    Determination of ultra trace elements is important in many disciplines both in basic and applied sciences. Numerous applications show their importance in medical science, environmental science, materials science, food processing and semiconductor industries and in maintaining the quality control of ultra pure chemicals and reagents. We report commissioning of a synchrotron based total reflection x-ray fluorescence (TXRF) facility on the BL-16 microfocus beamline of Indus-2. This paper describes the performance of the BL-16 TXRF spectrometer and the detailed description of its capabilities through examples of measured results.

  8. Microanalysis of old violin varnishes by total-reflection X-ray fluorescence

    NASA Astrophysics Data System (ADS)

    von Bohlen, Alex; Meyer, Friedrich

    1997-07-01

    Total reflection X-ray fluorescence was used to characterize elements (with Z>13) contained in varnishes applied by prominent violin makers during the last five centuries. Direct analyses of small flakes with masses <20 μg show a variety of elements. Some of these elements could be related to key elements of inorganic pigments and additives used to control some of the properties of a varnish. Higher amounts of Fe, As and Pb were found in old products, Mn, Co, Cu, Zn and Pb were used in more recent varnishes.

  9. Synchrotron total reflection X-ray fluorescence at BL-16 microfocus beamline of Indus-2

    SciTech Connect

    Tiwari, M. K. Singh, A. K. Das, Gangadhar Chowdhury, Anupam Lodha, G. S.

    2014-04-24

    Determination of ultra trace elements is important in many disciplines both in basic and applied sciences. Numerous applications show their importance in medical science, environmental science, materials science, food processing and semiconductor industries and in maintaining the quality control of ultra pure chemicals and reagents. We report commissioning of a synchrotron based total reflection x-ray fluorescence (TXRF) facility on the BL-16 microfocus beamline of Indus-2. This paper describes the performance of the BL-16 TXRF spectrometer and the detailed description of its capabilities through examples of measured results.

  10. Structure of two-component lipid membranes on solid support: An x-ray reflectivity study

    SciTech Connect

    Novakova, Eva; Giewekemeyer, Klaus; Salditt, Tim

    2006-11-15

    We report an x-ray reflectivity study of phospholipid membranes deposited on silicon by vesicle fusion. The samples investigated were composed of single phospholipid bilayers as well as two-component lipid bilayer systems with varied charge density. We show that the resolution obtained in the density profile across the bilayer is high enough to distinguish two head-group maxima in the profile if the sample is in the phase coexistence regime. The water layer between the bilayer and silicon is found to depend on the lipid surface charge density.

  11. Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

    SciTech Connect

    Su P.; Kaznatcheev K.; Wang, Y.; Burge, J.H.; Idir, M.

    2012-05-16

    In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision and accuracy better than 100 nrad (rms) and {approx}200 nrad (rms), respectively, with a lateral resolution of few mm or less. We present results of the calibration of the metrology systems, discuss their accuracy and address the precision in measuring a spherical mirror.

  12. Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach.

    PubMed

    Su, Peng; Wang, Yuhao; Burge, James H; Kaznatcheev, Konstantine; Idir, Mourad

    2012-05-21

    In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision and accuracy better than 100 nrad (rms) and ~200 nrad (rms), respectively, with a lateral resolution of few mm or less. We present results of the calibration of the metrology systems, discuss their accuracy and address the precision in measuring a spherical mirror. PMID:22714226

  13. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions.

    PubMed

    Ingerle, D; Meirer, F; Pepponi, G; Demenev, E; Giubertoni, D; Wobrauschek, P; Streli, C

    2014-09-01

    The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

  14. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

    NASA Astrophysics Data System (ADS)

    Ingerle, D.; Meirer, F.; Pepponi, G.; Demenev, E.; Giubertoni, D.; Wobrauschek, P.; Streli, C.

    2014-09-01

    The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

  15. Determination of trace elements in Syrian medicinal plants and their infusions by energy dispersive X-ray fluorescence and total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Khuder, A.; Sawan, M. Kh.; Karjou, J.; Razouk, A. K.

    2009-07-01

    X-ray fluorescence (XRF) and total-reflection X-ray fluorescence (TXRF) techniques suited well for a multi-element determination of K, Ca, Mn, Fe, Cu, Zn, Rb, and Sr in some Syrian medicinal plant species. The accuracy and the precision of both techniques were verified by analyzing the Standard Reference Materials (SRM) peach-1547 and apple leaves-1515. A good agreement between the measured concentrations of the previously mentioned elements and the certified values were obtained with errors less than 10.7% for TXRF and 15.8% for XRF. The determination of Br was acceptable only by XRF with an error less than 24%. Furthermore, the XRF method showed a very good applicability for the determination of K, Ca, Mn, Fe, Cu, Zn, Rb, Sr, and Br in infusions of different Syrian medicinal plant species, namely anise ( Anisum vulgare), licorice root ( Glycyrrhiza glabra), and white wormwood ( Artemisia herba-alba).

  16. Fitting X-ray multilayer reflectivities by means of the PPM code

    NASA Astrophysics Data System (ADS)

    Spiga, Daniele; Mirone, Alessandro; Ferrero, Claudio; Cotroneo, Vincenzo; Pareschi, Giovanni; Sanchez del Rio, Manuel; Vernani, Dervis

    2004-10-01

    A number of future hard X-ray (10-100 keV) telescopes will implement focusing optics with multilayer coatings. In this framework, we are developing (at INAF/Brera-Merate Astronomical Observatory) multilayer optics based on the e-beam deposition technique: this approach is suitable to coat very large surfaces at an high deposition rate; in order to test the performances of the deposited samples, X-ray reflectivity scans at the two "standard" photon energies of 8.05 and 17.4 keV are taken, returning very positive results with high peak reflectivities. However, the exact interpretation of the reflectivity curves is a complex task since it depends on a large number of parameters: the software PPM (Pythonic Program for Multilayers) has been recently developed by A. Mirone (ESRF) specifically to the aim of a friendly and fast determination of the parameters of multilayer structures. In particular, for this paper we present the layer-by-layer modelization of the characteristics (roughness, density, thickness) of multilayer stacks (Ni/C, Pt/C) by a multi-parametric "global" automatic optimization to reach the best fitting performances. In order to physically constrain the parameters, the data will be compared with the results of TEM measurements performed on the same samples, when available.

  17. Stochastic Fitting of Specular X-ray Reflectivity Data Using StochFit

    SciTech Connect

    Danauskas, Stephen M.; Li, Dongxu; Meron, Mati; Lin, Binhua; Lee, Ka Yee C.

    2010-09-21

    Specular X-ray reflectivity data provide detailed information on the electron density distribution at an interface. Typical modeling methods involve choosing a generic electron density distribution based on an initial speculation of the electron density profile from the physical parameters of the experimental system. This can lead to a biased set of solutions. StochFit provides stochastic model-independent and model-dependent methods for analyzing X-ray reflectivities of thin films at an interface. StochFit divides an electron density profile into many small boxes and stochastically varies the electron density of these boxes to locate the best fit to a measured reflectivity. Additionally, it provides the ability to perform model-dependent fitting with a stochastic search of the parameter space in order to locate the best possible fit. While model-independent profile search algorithms have been described previously, they are difficult to implement because of the heavy computational requirements, and there is a dearth of software available to the general scientific public utilizing these techniques. Several cases that illustrate the usefulness of these techniques are presented, with a demonstration of how they can be used in tandem.

  18. Reflection grating spectrometer onboard the ESA x-ray multi-mirror (XMM) mission

    NASA Astrophysics Data System (ADS)

    den Herder, Jan-Willem; Aarts, Henry J.; van den Berg, Marcel L.; Bixler, Jay V.; den Boggende, Antonius J.; Branduardi-Raymont, G.; Brinkman, Albert C.; Decker, Todd A.; Dubbeldam, Luc; Hailey, Charles J.; Jansen, Fred A.; Kahn, Steven M.; de Korte, Piet A.; Mauche, C. W.; Montesanti, Richard C.; Paerels, Frits B.; Spruijt, Hugo; Thomsen, K.; Verhoeve, P.; Zehnder, A.

    1994-09-01

    The Reflection Grating Spectrometer (RGS) onboard the ESA satellite XMM (X-ray Multi Mirror mission) combines a high resolving power (approximately 400 at 0.5 keV) with a large effective area (approximately 200 cm(superscript 2)). The spectral range selected for RGS (5 - 35 angstroms) contains the K shell transitions of N, O, Ne, Mg, Al, Si and S as well as the important L shell transitions of FE. The resolving power allows the study of a wide variety of challenging scientific questions. Detailed temperature diagnostics are feasible as the ionization balance is a unique function of the distribution of the electron temperature. Density diagnostics are provided by studying He-like triplets where the ratio of the forbidden to intercombination lines varies with density. Other fields of interest include the determination of elemental abundances, the study of optical depth effects, velocity diagnostics by measuring Doppler shifts and the estimate of magnetic fields through the observation of Zeeman splitting. The resolving power is obtained by an array of 240 gratings placed behind the mirrors of the telescope, dispersing about half of the X-rays in two spectroscopic orders. The X-rays are recorded by an array of 9 large format CCDs. These CCDs are operated in the frame transfer mode. They are back illuminated as the quantum efficiency of front illuminated devices is poor at low energies because of their poly-silicon gate structure. To suppress dark current the CCDs are passively cooled. In order to obtain the effective area of about 200 cm(superscript 2), grating arrays and CCD cameras are placed behind two of the three XMM telescopes. A model of RGS was tested last autumn ('93) at the Panter long beam X-ray facility in Munich. The model consisted of a subset of four mirrors, eight representative gratings covering a small section of the inner mirror shells and a CCD camera containing three CCDs. The purpose of these tests was to verify the resolution and sensitivity of

  19. Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy

    NASA Astrophysics Data System (ADS)

    Zastrau, U.; Förster, E.

    2014-09-01

    The integrated x-ray reflectivity of Potassium Hydrogen Phthalate (KAP) and Rubidium Hydrogen Phthalate (RAP) crystals is studied at a photon energy of (1740±14) eV using a double-crystal setup. The absolute measured reflectivities are in < 5% agreement with the values predicted by the dynamic diffraction theory for perfect crystals when absorption is included. Within 4% experimental error margins, specimen that were exposed to ambient conditions over many years show identical reflectivity as specimen that were cleaved just before the measurement. No differences are observed between cleaving off a 10 μm surface layer and splitting the entire crystal bulk of 2 mm thickness. We conclude that at 1.7 keV photon energy the penetration depth of ~ 1 μm is large compared to a potentially deteriorated surface layer of a few 10 nm.

  20. Full Polarization Analysis of Resonant Superlattice and Forbidden x-ray Reflections in Magnetite

    SciTech Connect

    Wilkins, S.B.; Bland, S.R.; Detlefs, B.; Beale, T.A.W.; Mazzoli, C.; Joly, Y.; Hatton, P.D.; Lorenzo, J.E.; Brabers, V.A.M.

    2009-12-02

    Despite being one of the oldest known magnetic materials, and the classic mixed valence compound, thought to be charge ordered, the structure of magnetite below the Verwey transition is complex and the presence and role of charge order is still being debated. Here, we present resonant x-ray diffraction data at the iron K-edge on forbidden (0, 0, 2n+1){sub C} and superlattice (0, 0, 2n+1/2)C reflections. Full linear polarization analysis of the incident and scattered light was conducted in order to explore the origins of the reflections. Through simulation of the resonant spectra we have confirmed that a degree of charge ordering takes place, while the anisotropic tensor of susceptibility scattering is responsible for the superlattice reflections below the Verwey transition. We also report the surprising result of the conversion of a significant proportion of the scattered light from linear to nonlinear polarization.

  1. Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

    SciTech Connect

    Mei, A. B.; Hellman, O.; Schlepuetz, C. M.; Rockett, A.; Chiang, T. -C.; Hultman, L.; Petrov, I.; Greene, J. E.

    2015-11-03

    Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations (h) over bar omega(j) (q), phonon densities of states g((h) over bar omega), and isochoric temperature-dependent vibrational heat capacities cv (T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are found to be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities cv (T), computed within the harmonic approximation from (h) over bar omega(j) (q) values, increase with temperature from 0.4 x 10-4 eV/atom K at 100 K to 1.4 x 10-4 eV/atom K at 200 K and 1.9 x 10-4 eV/atom K at 300 K, in excellent agreement with isobaric heat capacity values cp (T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲ θc where θc is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲ 10 nm.

  2. Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

    DOE PAGESBeta

    Mei, A. B.; Hellman, O.; Schlepuetz, C. M.; Rockett, A.; Chiang, T. -C.; Hultman, L.; Petrov, I.; Greene, J. E.

    2015-11-03

    Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations (h) over bar omega(j) (q), phonon densities of states g((h) over bar omega), and isochoric temperature-dependent vibrational heat capacities cv (T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are found tomore » be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities cv (T), computed within the harmonic approximation from (h) over bar omega(j) (q) values, increase with temperature from 0.4 x 10-4 eV/atom K at 100 K to 1.4 x 10-4 eV/atom K at 200 K and 1.9 x 10-4 eV/atom K at 300 K, in excellent agreement with isobaric heat capacity values cp (T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲ θc where θc is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲ 10 nm.« less

  3. Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

    NASA Astrophysics Data System (ADS)

    Mei, A. B.; Hellman, O.; Schlepütz, C. M.; Rockett, A.; Chiang, T.-C.; Hultman, L.; Petrov, I.; Greene, J. E.

    2015-11-01

    Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations ℏ ωj (q), phonon densities of states g (ℏ ω ), and isochoric temperature-dependent vibrational heat capacities cv(T ) . We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are found to be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities cv(T ) , computed within the harmonic approximation from ℏ ωj (q) values, increase with temperature from 0.4 ×10-4eV /atom K at 100 K to 1.4 ×10-4eV /atom K at 200 K and 1.9 ×10-4eV /atom K at 300 K, in excellent agreement with isobaric heat capacity values cp(T ) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲θc , where θc is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲10 nm .

  4. Probing the clumping structure of giant molecular clouds through the spectrum, polarisation and morphology of X-ray reflection nebulae

    NASA Astrophysics Data System (ADS)

    Molaro, Margherita; Khatri, Rishi; Sunyaev, Rashid A.

    2016-04-01

    We introduce a new method for probing global properties of clump populations in giant molecular clouds (GMCs) in the case where these act as X-ray reflection nebulae (XRNe), based on the study of the clumping's overall effect on the reflected X-ray signal, in particular on the Fe K-α line's shoulder. We consider the particular case of Sgr B2, one of the brightest and most massive XRN in the Galactic center (GC) region. We parametrise the gas distribution inside the cloud using a simple clumping model with theslope of the clump mass function (α), the minimum clump mass (mmin), the fraction of the cloud's mass contained in clumps (fDGMF), and the mass-size relation of individual clumps as free parameters, and investigate how these affect the reflected X-ray spectrum. In the case of very dense clumps, similar to those presently observed in Sgr B2, these occupy a small volume of the cloud and present a small projected area to the incoming X-ray radiation. We find that these contribute negligibly to the scattered X-rays. Clump populations with volume-filling factors of >10-3 do leave observational signatures, that are sensitive to the clump model parameters, in the reflected spectrum and polarisation. Future high angular resolution X-ray observations could therefore complement the traditional optical and radio observations of these GMCs, and prove to be a powerful probe in the study of their internal structure. Clumps in GMCs should further be visible both as bright spots and regions of heavy absorption in high resolution X-ray observations. We therefore also study the time-evolution of the X-ray morphology, under illumination by a transient source, as a probe of the 3D distribution and column density of individual clumps by future X-ray observatories.

  5. A REFLECTION MODEL FOR THE CYCLOTRON LINES IN THE SPECTRA OF X-RAY PULSARS

    SciTech Connect

    Poutanen, Juri; Mushtukov, Alexander A.; Tsygankov, Sergey S.; Nagirner, Dmitrij I.; Suleimanov, Valery F.; Doroshenko, Victor; Lutovinov, Alexander A.

    2013-11-10

    Cyclotron resonance scattering features observed in the spectra of some X-ray pulsars show significant changes of the line energy with the pulsar luminosity. At high luminosities, these variations are often associated with the onset and growth of the accretion column, which is believed to be the origin of the observed emission and of the cyclotron lines. However, this scenario inevitably implies a large gradient of the magnetic field strength within the line-forming region, which makes the formation of the observed line-like features problematic. Moreover, the observed variation of the cyclotron line energy is much smaller than could be anticipated for the corresponding luminosity changes. We argue here that a more physically realistic situation is that the cyclotron line forms when the radiation emitted by the accretion column is reflected from the neutron star surface, where the gradient of the magnetic field strength is significantly smaller. Here we develop a reflection model and apply it to explain the observed variations of the cyclotron line energy in a bright X-ray pulsar V 0332+53 over a wide range of luminosities.

  6. In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1(0) ordering in (57)Fe/Pt multilayers.

    PubMed

    Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil; Leitenberger, Wolfram; Pietsch, U

    2009-05-01

    In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1(0) phase formation in [Fe(19 Å)/Pt(25 Å)]( × 10) multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1(0) phase, (ii) the ordered fct L 1(0) FePt peaks start to appear at 320 °C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Mössbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 °C annealed multilayers. The magnetic data for the 400 °C annealed sample indicate that the magnetization is at an angle of ∼50° from the plane of the film. PMID:21825468

  7. Absolute reflectivity measurements at 44.79 A of sputter deposited multilayer x-ray mirrors.

    PubMed

    Arbaoui, M; Barchewitz, R; Sella, C; Youn, K B

    1990-02-01

    Multilayer x-ray mirrors have been deposited using a dc triode sputtering system, which incorporates an accurate method of thickness monitoring based on the dependence of the deposition rate on the target current. Thickness can be controlled with an accuracy of better than 0.1 A. High efficiency W-C and Ni-C multilayer mirrors have been synthesized and tested at 1.54-A (CuKoalpha) and 44.79-A (CKalpha). Absolute reflectivity measurements at lambda = 44.79-A (CKalpha) have been carried out. In this case the incident beam is previously polarized by a premonochromator equipped with a pair of parallel-plane multilayer mirrors fixed at an angle close to the Brewster (theta ? 45 degrees ). Thus the measured reflectivities are not affected by a progressive variation of the P-component. PMID:20556133

  8. Synchrotron x-ray reflectivity study of oxidation/passivation of copper and silicon.

    SciTech Connect

    Chu, Y.; Nagy, Z.; Parkhutik, V.; You, H.

    1999-07-21

    Synchrotron x-ray-scattering technique studies of copper and silicon electrochemical interfaces are reported. These two examples illustrate the application of synchrotron x-ray techniques for oxidation, passivation, and dissolution of metals and semiconductors.

  9. Total reflection X-ray fluorescence (TXRF) for direct analysis of aerosol particle samples.

    PubMed

    Bontempi, E; Zacco, A; Benedetti, D; Borgese, L; Colombi, P; Stosnach, H; Finzi, G; Apostoli, P; Buttini, P; Depero, L E

    2010-04-14

    Atmospheric aerosol particles have a great impact on the environment and on human health. Routine analysis of the particles usually involves only the mass determination. However, chemical composition and phases provide fundamental information about the particles' origins and can help to prevent health risks. For example, these particles may contain heavy metals such as Pb, Ni and Cd, which can adversely affect human health. In this work, filter samples were collected in Brescia, an industrial town located in Northern Italy. In order to identify the chemical composition and the phases of the atmospheric aerosols, the samples were analysed by means of total reflection X-ray fluorescence (TXRF) spectrometry with a laboratory instrument and X-ray microdiffraction at Synchrotron Daresbury Laboratories, Warrington (Cheshire, UK). The results are discussed and correlated to identify possible pollution sources. The novelty of this analytical approach is that filter samples for TXRF were analysed directly and did not require chemical pretreatment to leach elements from the aerosol particulates. The results of this study clearly show that TXRF is a powerful technique for the analysis of atmospheric aerosols on 'as-received' filters, thereby leaving samples intact and unaltered for possible subsequent analyses by other methods. In addition, the low detection limits for many elements (low ng/cm2) indicate that this method may hold promise in various application fields, such as nanotechnology. PMID:20480822

  10. Genesis Sample Surface Contamination Study using Total-reflection X-Ray Fluorescence (TXRF)

    NASA Astrophysics Data System (ADS)

    Brennan, S.; Luening, K.; Pianetta, P.; Ishii, H. A.; Burnett, D. S.

    2005-12-01

    We have used synchrotron-based Total-reflection X-Ray Fluorescence (TXRF) to measure the surface and near-surface contamination of Genesis flight spare material as well as one piece of sapphire which flew on the mission. Flight spare samples included uncoated, Al-coated and Au-coated sapphire wafers and diamond-like carbon (DLC) on silicon. These studies were performed to determine the suitability of TXRF for the study of Genesis materials. The technique is optimally suited and highly surface sensitive for elements between Na and Br with sensitivities ranging from 1e9 to 1e12 atoms/cm2. By changing the x-ray angle of incidence one can vary the sampling depth from ~ 100 Å to several thousand Å. We found that the level of contamination of the flight-spare material varied widely. For the case of the returned piece of sapphire there were concentrations of Ge on the surface approaching monolayer coverage.

  11. In Situ X-ray Reflectivity Studies of Protein Adsorption onto Functionalized Surfaces

    NASA Astrophysics Data System (ADS)

    Richter, Andrew

    2007-03-01

    The adsorption of protein films onto solid surfaces, both artificial and naturally occurring, have been widely studied using a variety of techniques due to their importance in medicine, biomedical applications, and the general understanding of protein structure and function. What have yet to be performed are in situ, time-resolved, high-resolution structural studies of these systems. We have begun a project that uses the technique of in situ x-ray reflectivity to obtain highly resolved structural information with time resolution on the order of minutes. This talk will present our first findings of serum albumin and immunoglobulin G films on hydrophobic self-assembled monolayers. The protein films are readily observable, showing extensive denaturing after adsorption with a slow decay of density into the aqueous solution. Additionally, a thin low-density region that occurs between the hydrophobic film and the solution persists after protein deposition. Comparisons to films that are removed from solution, the influence of solution concentration, the effects of x-ray damage, and the time scales for protein film formation and evolution will also be discussed.

  12. Impulsive solar X-ray bursts. 4: Polarization, directivity and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

    NASA Technical Reports Server (NTRS)

    Langer, S. H.; Petrosian, V.

    1976-01-01

    A Monte Carlo method is described for evaluation of the spectrum, directivity and polarization of X-rays diffusely reflected from stellar photospheres. the accuracy of the technique is evaluated through comparison with analytic results. Using the characteristics of the incident X-rays of the model for solar X-ray flares, the spectrum, directivity and polarization of the reflected and the total X-ray fluxes are evaluated. The results are compared with observations.

  13. Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere

    DOEpatents

    Thoe, Robert S.

    1991-01-01

    Method and apparatus for producing sharp, chromatic, magnified images of X-ray emitting objects, are provided. The apparatus, which constitutes an X-ray microscope or telescope, comprises a connected collection of Bragg reflecting planes, comprised of either a bent crystal or a synthetic multilayer structure, disposed on and adjacent to a locus determined by a spherical surface. The individual Bragg planes are spatially oriented to Bragg reflect radiation from the object location toward the image location. This is accomplished by making the Bragg planes spatially coincident with the surfaces of either a nested series of prolate ellipsoids of revolution, or a nested series of spheres. The spacing between the Bragg reflecting planes can be tailored to control the wavelengths and the amount of the X-radiation that is Bragg reflected to form the X-ray image.

  14. Total reflection X-ray fluorescence and energy-dispersive X-ray fluorescence analysis of runoff water and vegetation from abandoned mining of Pb Zn ores

    NASA Astrophysics Data System (ADS)

    Marques, A. F.; Queralt, I.; Carvalho, M. L.; Bordalo, M.

    2003-12-01

    The present work reports on the heavy metal content: Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Cd and Pb in running waters and vegetation around abandoned mining areas. Two species of mosses ( Dicranum sp. and Pleurocarpus sp.) and three different species of wild grass ( Bromus sp., Rumex sp. and Pseudoavena sp.) growing on the surrounding areas of old lead-zinc mines (Aran Valley, Pyrenees, NE Spain) have been analyzed. Both water and vegetation were collected in two different sampling places: (a) near the mine gallery water outlets and (b) on the landfill close to the abandoned mineral concentration factories. For the heavy metal content determination, two different techniques were used: total reflection X-ray fluorescence for water analysis and energy-dispersive X-ray fluorescence for vegetation study. Surface waters around mine outlets exhibit anomalous content of Co, Ni, Zn, Cd. Stream waters running on mining landfills exhibit higher Cu, Zn, Cd and Pb than those of the waters at the mine gallery outlets. The results allow us to assess the extent of the environmental impact of the mining activities on the water quality. The intake of these elements by vegetation was related with the sampling place, reflecting the metal water content and the substrate chemistry. Accumulation of metals in mosses is higher than those exhibited in wild grasses. Furthermore, different levels of accumulation were found in different wild grass. Rumex sp. presented the lowest metal concentrations, while Pseudoavena sp. reported the highest metal content.

  15. A setup for synchrotron-radiation-induced total reflection X-ray fluorescence and X-ray absorption near-edge structure recently commissioned at BESSY II BAMline.

    PubMed

    Fittschen, U; Guilherme, A; Böttger, S; Rosenberg, D; Menzel, M; Jansen, W; Busker, M; Gotlib, Z P; Radtke, M; Riesemeier, H; Wobrauschek, P; Streli, C

    2016-05-01

    An automatic sample changer chamber for total reflection X-ray fluorescence (TXRF) and X-ray absorption near-edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF-XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml(-1) to µg ml(-1)). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml(-1)) for Ni were found. TXRF-XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state. PMID:27140163

  16. Determination of layer-thickness variation in periodic multilayer by x-ray reflectivity

    SciTech Connect

    Jiang Hui; Zhu Jingtao; Xu Jing; Wang Xiaoqiang; Wang Zhanshan; Watanabe, Makoto

    2010-05-15

    A method basically determining individual layer thicknesses in actual periodic multilayers has been developed, that solves simultaneous equations of positions of peaks appearing in wavelet transform curve of x-ray grazing incidence reflectivity. The determination was demonstrated on a Ni/C periodic multilayer fabricated by magnetron sputtering. Using the layer thicknesses obtained by the method, further accurate of thickness, roughness, and density of each layer was performed by Parratt's model. The special feature that the topmost and bottom-most layers were thicker than other layers was clearly observed. The former is attributed to oxidation and the latter is attributed to the effect of deposition on thick substrate. The mean fluctuations of other layers are 2.6% in C layers and 4.2% in Ni layers attributed to random fluctuations at deposition. Numerical analysis and statistical hypothesis tests have been carried out to discuss noncumulative and cumulative layer-thickness fluctuations in fabrication process.

  17. Nanofocusing of X-ray free-electron lasers by grazing-incidence reflective optics

    PubMed Central

    Yamauchi, Kazuto; Yabashi, Makina; Ohashi, Haruhiko; Koyama, Takahisa; Ishikawa, Tetsuya

    2015-01-01

    Total-reflection mirror devices for X-ray free-electron laser focusing are discussed in terms of optical design, mirror-fabrication technology, a wavefront diagnosis method and radiation-damage testing, as a review of the present status of the focusing optics at the SPring-8 angstrom compact free-electron laser (SACLA). Designed beam sizes of 1 µm and 50 nm, and spot sizes almost matching prediction have been achieved and used to explore topics at the forefront of natural science. The feasibility of these devices is determined to be sufficient for long-term and stable operation at SACLA by investigating the radiation-damage threshold and achievable accuracies in the mirror figure and alignment. PMID:25931073

  18. A triple axis double crystal multiple reflection camera for ultra small angle X-ray scattering

    NASA Astrophysics Data System (ADS)

    Lambard, Jacques; Lesieur, Pierre; Zemb, Thomas

    1992-06-01

    To extend the domain of small angle X-ray scattering requires multiple reflection crystals to collimate the beam. A double crystal, triple axis X-ray camera using multiple reflection channel cut crystals is described. Procedures for measuring the desmeared scattering cross-section on absolute scale are described as well as the measurement from several typical samples : fibrils of collagen, 0.3 μm diameter silica spheres, 0.16 μm diameter interacting latex spheres, porous lignite coal, liquid crystals in a surfactant-water system, colloidal crystal of 0.32 μm diameter silica spheres. L'extension du domaine de diffusion des rayons-X vers les petits angles demande l'emploi de cristaux à réflexions multiples pour collimater le faisceau. Nous décrivons une caméra à rayons-X à trois axes où les réflexions multiples sont réalisées dans deux cristaux à gorge. Nous donnons ensuite les procédures de déconvolution pour obtenir la section efficace de diffusion en échelle absolue, ainsi que les résultats des mesures effectuées avec plusieurs échantillons typiques : fibres de collagène, sphères de silice de 0,3 μm de diamètre, sphères de latex de 0,16 μm de diamètre en interaction, charbon lignite poreux, cristaux liquides formés dans un système eau-tensioactif, solution colloïdale de sphères de silice de 0,32 μm de diamètre.

  19. Examining molecular clouds in the Galactic Centre region using X-ray reflection spectra simulations.

    NASA Astrophysics Data System (ADS)

    Walls, M.; Chernyakova, M.; Terrier, R.; Goldwurm, A.

    2016-09-01

    In the centre of our galaxy lies a super-massive black hole, identified with the radio source Sagittarius A⋆. This black hole has an estimated mass of around 4 million solar masses. Although Sagittarius A⋆ is quite dim in terms of total radiated energy, having a luminosity that is a factor of 1010 lower than its Eddington luminosity, there is now compelling evidence that this source was far brighter in the past. Evidence derived from the detection of reflected X-ray emission from the giant molecular clouds in the galactic centre region. However, the interpretation of the reflected emission spectra cannot be done correctly without detailed modelling of the reflection process. Attempts to do so can lead to an incorrect interpretation of the data. In this paper we present the results of a Monte Carlo simulation code we developed in order to fully model the complex processes involved in the emerging reflection spectra. The simulated spectra can be compared to real data in order to derive model parameters and constrain the past activity of the black hole. In particular we apply our code to observations of Sgr B2, in order to constrain the position and density of the cloud and the incident luminosity of the central source. The results of the code have been adapted to be used in Xspec by a large community of astronomers.

  20. Improved reflection models of black hole accretion disks: Treating the angular distribution of X-rays

    SciTech Connect

    García, J.; Steiner, J. F.; McClintock, J. E.; Brenneman, L. E-mail: jsteiner@head.cfa.harvard.edu E-mail: lbrenneman@cfa.harvard.edu; and others

    2014-02-20

    X-ray reflection models are used to constrain the properties of the accretion disk, such as the degree of ionization of the gas and the elemental abundances. In combination with general relativistic ray tracing codes, additional parameters like the spin of the black hole and the inclination to the system can be determined. However, current reflection models used for such studies only provide angle-averaged solutions for the flux reflected at the surface of the disk. Moreover, the emission angle of the photons changes over the disk due to relativistic light bending. To overcome this simplification, we have constructed an angle-dependent reflection model with the XILLVER code and self-consistently connected it with the relativistic blurring code RELLINE. The new model, relxill, calculates the proper emission angle of the radiation at each point on the accretion disk and then takes the corresponding reflection spectrum into account. We show that the reflected spectra from illuminated disks follow a limb-brightening law highly dependent on the ionization of disk and yet different from the commonly assumed form I∝ln (1 + 1/μ). A detailed comparison with the angle-averaged model is carried out in order to determine the bias in the parameters obtained by fitting a typical relativistic reflection spectrum. These simulations reveal that although the spin and inclination are mildly affected, the Fe abundance can be overestimated by up to a factor of two when derived from angle-averaged models. The fit of the new model to the Suzaku observation of the Seyfert galaxy Ark 120 clearly shows a significant improvement in the constraint of the physical parameters, in particular by enhancing the accuracy in the inclination angle and the spin determinations.

  1. NuSTAR Spectroscopy of Multi-component X-Ray Reflection from NGC 1068

    NASA Astrophysics Data System (ADS)

    Bauer, Franz E.; Arévalo, Patricia; Walton, Dominic J.; Koss, Michael J.; Puccetti, Simonetta; Gandhi, Poshak; Stern, Daniel; Alexander, David M.; Baloković, Mislav; Boggs, Steve E.; Brandt, William N.; Brightman, Murray; Christensen, Finn E.; Comastri, Andrea; Craig, William W.; Del Moro, Agnese; Hailey, Charles J.; Harrison, Fiona A.; Hickox, Ryan; Luo, Bin; Markwardt, Craig B.; Marinucci, Andrea; Matt, Giorgio; Rigby, Jane R.; Rivers, Elizabeth; Saez, Cristian; Treister, Ezequiel; Urry, C. Megan; Zhang, William W.

    2015-10-01

    We report on high-energy X-ray observations of the Compton-thick Seyfert 2 galaxy NGC 1068 with NuSTAR, which provide the best constraints to date on its >10 keV spectral shape. The NuSTAR data are consistent with those from past and current instruments to within cross-calibration uncertainties, and we find no strong continuum or line variability over the past two decades, which is in line with its X-ray classification as a reflection-dominated Compton-thick active galactic nucleus. The combined NuSTAR, Chandra, XMM-Newton, and Swift BAT spectral data set offers new insights into the complex secondary emission seen instead of the completely obscured transmitted nuclear continuum. The critical combination of the high signal-to-noise NuSTAR data and the decomposition of the nuclear and extranuclear emission with Chandra allow us to break several model degeneracies and greatly aid physical interpretation. When modeled as a monolithic (i.e., a single NH) reflector, none of the common Compton reflection models are able to match the neutral fluorescence lines and broad spectral shape of the Compton reflection hump without requiring unrealistic physical parameters (e.g., large Fe overabundances, inconsistent viewing angles, or poor fits to the spatially resolved spectra). A multi-component reflector with three distinct column densities (e.g., with best-fit values of NH of 1.4 × 1023, 5.0 × 1024, and 1025 cm-2) provides a more reasonable fit to the spectral lines and Compton hump, with near-solar Fe abundances. In this model, the higher NH component provides the bulk of the flux to the Compton hump, while the lower NH component produces much of the line emission, effectively decoupling two key features of Compton reflection. We find that ≈30% of the neutral Fe Kα line flux arises from >2″ (≈140 pc) and is clearly extended, implying that a significant fraction (and perhaps most) of the <10 keV reflected component arises from regions well outside a parsec

  2. Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET Crystals

    SciTech Connect

    Haugh, M J; Ross, P W; Regan, P W; Magoon, J; Shoup, M J; Barrios, M A; Emig, J A; Fournier, K B

    2012-04-26

    Spectroscopy provides valuable information about the temperature and density of a compressed pellet in a plasma. Elliptically curved pentaerythritol (PET) crystals are used as components for spectrometers. Their elliptical geometry gives several advantages related to spectral energy range, source focus, and spectral image compression.[1] The crystal curvature increases the spectrometer throughput but at the cost of a loss in resolution. Four different crystals are used in a spectrometer at the National Ignition Facility (NIF) target chamber at Lawrence Livermore National Laboratory (LLNL). Figure 1 shows the arrangement of the elliptical PET crystals in the snout of a NIF target diagnostic shown in Figure 2. The spectrum from the crystals is captured by four image plates located behind the crystals. A typical mandrel, the darkened section, upon which the PET crystal is glued, is shown in Figure 3, which also shows the complete ellipse. There are four elliptical segment types, each having the same major axis but a different minor axis. The crystals are 150 mm long in the diffraction direction and 25.4 mm high. Two crystals of each type were calibrated. The throughput for each spectrometer is determined by the integrated reflectivity of the PET crystal.[1] The goal of this effort was to measure the reflectivity curve of the PET curved crystal at several energies and determine the integrated reflectivity and the curve width as a function of the X-ray spectral energy and location on the ellipse where the beam strikes.

  3. Submicron-resolved X-ray topography using asymmetric-reflection magnifiers

    NASA Astrophysics Data System (ADS)

    Tanuma, R.; Ohsawa, M.

    2004-10-01

    This paper describes a study of synchrotron-radiated X-ray topography in which a topographic image was magnified by asymmetric reflection (ASR) to obtain submicron resolution. The samples used were trenched Si(100) wafers. Three diffraction schemes were used: Si-022 anomalous transmission with Si-311 ASR magnification ( E=8.8 keV), Si-044 Laue-case reflection with Si-511 ASR magnification ( E=21.4 keV), and Si-440 Bragg-case reflection with Si-311 ASR magnification ( E=8.8 keV). Grazing angles in the ASRs were 0.28-0.36°, which were 1.6-3.4 times corresponding critical angles. In these experiments, we obtained one-dimensionally expanded topographs, and the minimum spatial resolution reached was below 1 μm. A theoretical study provided the limits of the spatial resolutions, some of which are less than 0.1 μm if Si-crystal ASR magnifiers are used.

  4. Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: Semi-quantitative approach

    NASA Astrophysics Data System (ADS)

    Fernández-Ruiz, R.; García-Heras, M.

    2007-10-01

    Total-reflection X-ray fluorescence spectrometry has been compared with Instrumental Neutron Activation Analysis in order to test its potential application to the study of archaeological ceramics in the archaeometric field. Two direct solid non-chemical sample preparation procedures have been checked: solid sedimentation and solid chemical homogenization. For sedimentation procedure, total-reflection X-ray fluorescence allows the analysis of the elemental composition with respect to the size fraction but not the average evaluation of the composition. For solid chemical homogenization procedure, total-reflection X-ray fluorescence provides precise (from 0.8% to 27% of coefficient of variation) and accurate results (from 91% to 110% of recovery) for 15 elements (Cr, Hf, Ni, Rb, Al, Ba, Ca, K, Mn, Ti, V, Cu, Ga, Y and Fe) with an easy sample preparation process of the solid clay and without previous chemical treatment. The influence of the particle sizes has been checked by total-reflection X-ray fluorescence sample angle scans and anomalous behaviors have been found for three additional detected elements: As, Sr and Zn, which can be attributed to interference effects of the mineral grain sizes of their associated chemical phases in the total-reflection X-ray fluorescence interference region. The solid chemical homogenization procedure produces data useful for archaeological interpretation, which is briefly illustrated by a case-study. Finally, the decantation procedure data can be also useful for size chemical speciation and, consequently, for alternative environmental total-reflection X-ray fluorescence applications.

  5. Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence-X-ray absorption near edge structure analysis

    NASA Astrophysics Data System (ADS)

    Polgári, Zs.; Meirer, F.; Sasamori, S.; Ingerle, D.; Pepponi, G.; Streli, C.; Rickers, K.; Réti, A.; Budai, B.; Szoboszlai, N.; Záray, G.

    2011-03-01

    X-ray absorption near edge structure (XANES) analysis in combination with synchrotron radiation induced total reflection X-ray fluorescence (SR-TXRF) acquisition was used to determine the oxidation state of Fe in human cancer cells and simultaneously their elemental composition by applying a simple sample preparation procedure consisting of pipetting the cell suspension onto the quartz reflectors. XANES spectra of several inorganic and organic iron compounds were recorded and compared to that of different cell lines. The XANES spectra of cells, independently from the phase of cell growth and cell type were very similar to that of ferritin, the main Fe store within the cell. The spectra obtained after CoCl 2 or NiCl 2 treatment, which could mimic a hypoxic state of cells, did not differ noticeably from that of the ferritin standard. After 5-fluorouracil administration, which could also induce an oxidative-stress in cells, the absorption edge position was shifted toward higher energies representing a higher oxidation state of Fe. Intense treatment with antimycin A, which inhibits electron transfer in the respiratory chain, resulted in minor changes in the spectrum, resembling rather the N-donor Fe-α,α'-dipyridyl complex at the oxidation energy of Fe(III), than ferritin. The incorporation of Co and Ni in the cells was followed by SR-TXRF measurements.

  6. Experimental Procedures for Determining the Invariant Triplet-Phases of X-Ray Reflections.

    NASA Astrophysics Data System (ADS)

    Nicolosi, Joseph Anthony

    The phases of x-ray reflections are retained when three-beams diffract simultaneously (Post, 1977, 1979). The phase information can be extracted from the angular distribution of diffracted intensity about the three beam setting. We have investigated methods of optimizng experimental procedures and have developed instrumentation for resolving the intensity asymmetries associated with n-beam interactions in centrosymmetric crystals. A device, which employs two crystals in a skew-parallel arrangement, was designed and used to produce monochromatic ((DELTA)(lamda)/(lamda) (TURN) 5 x 10('-4)) and highly collimated ((alpha)(,(theta)) (TURN) (alpha)(,(omega)) (LESSTHEQ) 60") incident radiation. A 6000 Watt rotating anode x-ray generator was used with a (300 (mu)m)('2) projected focus. An automated diffractometer, which incorporates "absolute" optical encoders, was used to orient and drive the study crystals with an accuracy of (+OR-) 0.001(DEGREES). These experimental procedures yielded an appreciable improvement in sensitivity over procedures used previously which utilized polychromatic and more divergent incident radiation. The sensitivity of our procedures has been checked using perfect crystals of Germanium and Silicon. The improved techniques were used to determine more than 200 triplet-phases experimentally in mosaic crystals of Lead Molybdate and Sulfamic Acid. The experimental phases agreed in all cases with those calculated from the known atomic coordinates of the compounds. The bases for generalized procedures to be used with crystals having large unit cells are discussed. Methods of applying the phase determining rules and estimating the approximate magnitudes of the n-beam interactions are described. The basis for a generalized experimental data collection procedure not restricted to the Renninger geometry is discussed. Such procedures require the use of automated techniques for calculation of experimental parameters of the samples studied.

  7. Bromine and bromide content in soils: Analytical approach from total reflection X-ray fluorescence spectrometry.

    PubMed

    Gallardo, Helena; Queralt, Ignasi; Tapias, Josefina; Candela, Lucila; Margui, Eva

    2016-08-01

    Monitoring total bromine and bromide concentrations in soils is significant in many environmental studies. Thus fast analytical methodologies that entail simple sample preparation and low-cost analyses are desired. In the present work, the possibilities and drawbacks of low-power total reflection X-ray fluorescence spectrometry (TXRF) for the determination of total bromine and bromide contents in soils were evaluated. The direct analysis of a solid suspension using 20 mg of fine ground soil (<63 μm) gave a 3.7 mg kg(-1) limit of detection for bromine which, in most cases, was suitable for monitoring total bromine content in soils (Br content range in soils = 5-40 mg kg(-1)). Information about bromide determination in soils is also possible by analyzing the Br content in water soil extracts. In this case, the TXRF analysis can be directly performed by depositing 10 μL of the internal standardized soil extract sample on a quartz glass reflector in a measuring time of 1500 s. The bromide limit of detection by this approach was 10 μg L(-1). Good agreement was obtained between the TXRF results for the total bromine and bromide determinations in soils and those obtained by other popular analytical techniques, e.g. energy dispersive X-ray fluorescence spectrometry (total bromine) and ionic chromatography (bromide). As a study case, the TXRF method was applied to study bromine accumulation in two agricultural soils fumigated with a methyl bromide pesticide and irrigated with regenerated waste water. PMID:27179429

  8. X-ray Reflected Spectra from Accretion Disk Models. III. A Complete Grid of Ionized Reflection Calculations

    NASA Technical Reports Server (NTRS)

    Garcia, J.; Dauser, T.; Reynolds, C. S.; Kallman, T. R.; McClintock, J. E.; Wilms, J.; Ekmann, W.

    2013-01-01

    We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Gamma of the illuminating radiation, the ionization parameter zeta at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A(sub Fe) relative to the solar value. The ranges of the parameters covered are: 1.2 <= Gamma <= 3.4, 1 <= zeta <= 104, and 0.5 <= A(sub Fe) <= 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file suitable for the analysis of X-ray observations via the atable model in xspec. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of xillver.

  9. X-RAY REFLECTED SPECTRA FROM ACCRETION DISK MODELS. III. A COMPLETE GRID OF IONIZED REFLECTION CALCULATIONS

    SciTech Connect

    Garcia, J.; McClintock, J. E.; Dauser, T.; Wilms, J.; Eikmann, W.; Reynolds, C. S.; Kallman, T. R. E-mail: jem@cfa.harvard.edu E-mail: thomas.dauser@sternwarte.uni-erlangen.de E-mail: wiebke.eikmann@sternwarte.uni-erlangen.de

    2013-05-10

    We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code XILLVER that incorporates new routines and a richer atomic database. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index {Gamma} of the illuminating radiation, the ionization parameter {xi} at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A{sub Fe} relative to the solar value. The ranges of the parameters covered are 1.2 {<=} {Gamma} {<=} 3.4, 1 {<=} {xi} {<=} 10{sup 4}, and 0.5 {<=} A{sub Fe} {<=} 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file (http://hea-www.cfa.harvard.edu/{approx}javier/xillver/) suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.

  10. Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer

    SciTech Connect

    Bixler, J.V.; Craig, W.; Decker, T.; Aarts, H.; Boggende, T. den; Brinkman, A.C.; Burkert, W.; Brauninger, H.; Branduardi-Raymont, G.; Dubbeldam, L.

    1994-07-12

    X-ray calibration of the Electro-Optical Breadboard Model (EOBB) of the XXM Reflection Grating Spectrometer has been carried out at the Panter test facility in Germany. The EOBB prototype optics consisted of a four-shell grazing incidence mirror module followed by an array of eight reflection gratings. The dispersed x-rays were detected by an array of three CCDs. Line profile and efficiency measurements where made at several energies, orders, and geometric configurations for individual gratings and for the grating array as a whole. The x-ray measurements verified that the grating mounting method would meet the stringent tolerances necessary for the flight instrument. Post EOBB metrology of the individual gratings and their mountings confirmed the precision of the grating boxes fabrication. Examination of the individual grating surface`s at micron resolution revealed the cause of anomalously wide line profiles to be scattering due to the crazing of the replica`s surface.

  11. [Development of X-ray Reflection Grating Technology for the Constellation-X Mission

    NASA Technical Reports Server (NTRS)

    Schattenburg, Mark L.

    2005-01-01

    This Grant supports MIT technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we have focused our efforts on extending our Nanoruler grating fabrication tool to enable it to perform variable-period scanning-beam interference lithography (VP-SBIL). This new capability required extensive optical and mechanical improvements to the system. The design phase of this work is largely completed and key components are now on order and assembly has begun. Over the next several months the new VP-SBIL Nanoruler system will be completed and testing begun. We have also demonstrated a new technique for patterning gratings using the Nanoruler called Doppler mode, which will be important for patterning the radial groove gratings for the RGS using the new VP-SBIL system. Flat and thin grating substrates will be critical for the RGS. In the last year we demonstrated a new technique for flattening thin substrates using magneto-rheologic fluid polishing (MRF) and achieved 2 arcsecond flatness with a 0.5 mm-thick substrate-a world's record. This meets the Con X requirement for grating substrate flatness.

  12. A soft X-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

    DOE PAGESBeta

    Allured, Ryan; Kaaret, Philip; Fernandez-Perea, Monica; Soufli, Regina; Alameda, Jennifer B.; Pivovaroff, Michael J.; Gullikson, Eric M.

    2013-04-12

    A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter (BRP) on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90° angle to the BRP detector, and transmit 2–10 keV X-rays to the primary polarimeter. The transmission requirement prevents the use of a thick substrate, so a 2 μm thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developedmore » and deposited via magnetron sputtering with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Furthermore, reflectance and transmission measurements of BRP prototype elements closely match theoretical predictions, both before and after rigorous environmental testing.« less

  13. A soft X-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

    SciTech Connect

    Allured, Ryan; Kaaret, Philip; Fernandez-Perea, Monica; Soufli, Regina; Alameda, Jennifer B.; Pivovaroff, Michael J.; Gullikson, Eric M.

    2013-04-12

    A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter (BRP) on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90° angle to the BRP detector, and transmit 2–10 keV X-rays to the primary polarimeter. The transmission requirement prevents the use of a thick substrate, so a 2 μm thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developed and deposited via magnetron sputtering with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Furthermore, reflectance and transmission measurements of BRP prototype elements closely match theoretical predictions, both before and after rigorous environmental testing.

  14. Studies of print-through and reflectivity of x-ray mirrors using thin carbon-fiber-reinforced plastic

    NASA Astrophysics Data System (ADS)

    Sugita, Satoshi; Awaki, Hisamitsu; Yoshioka, Kenya; Ogi, Keiji; Kunieda, Hideyo; Matsumoto, Hironori; Miyazawa, Takuya; Mitsuishi, Ikuyuki; Iwase, Toshihiro; Saji, Shigetaka; Tachibana, Sasagu; Maejima, Masato; Yoshikawa, Shun; Shima, Naoki; Ishikawa, Takashi; Hamada, Takayoshi; Ishida, Naoki; Akiyama, Hiromichi; Kishimoto, Kazuaki; Utsunomiya, Shin; Kamiya, Tomohiro; Uesugi, Kentaro; Suzuki, Yoshio

    2016-01-01

    We fabricated x-ray mirrors from carbon-fiber-reinforced plastic with a tightly nested design for x-ray satellites, using a replication method for the surfaces. We studied the effects of print-through on the mirror surface as a function of curing temperature. With room temperature curing, the root-mean-square value of the surface error was 0.8 nm. The reflectivity was measured using 8-keV x-rays, and the roughness was calculated as 0.5 nm by model fitting-comparable to that of the ASTRO-H/HXT mirror. We verified the long-term stability of the mirror surface over 6 months. We fabricated Wolter type-I quadrant-shell mirrors with a diameter of 200 mm and performed x-ray measurements at BL20B2 in the SPring-8 synchrotron radiation facility. We obtained reflection images of the mirrors using a 20-keV x-ray spot beam with a slit size of 10×1 mm in the radial and circumferential directions, respectively. The averaged half-power diameter (HPD) of the images in one mirror was 1.2 arc min in the circumferential center of the mirror and 3.0 arc min at the edge. In the spot images with a smaller slit size of 10×0.2 mm, we achieved an HPD of 0.38 arc min in the best case.

  15. X-ray absorption and reflection as probes of the GaN conduction bands: Theory and experiments

    SciTech Connect

    Lambrecht, W.R.L.; Rashkeev, S.N.; Segall, B.

    1997-04-01

    X-ray absorption measurements are a well-known probe of the unoccupied states in a material. The same information can be obtained by using glancing angle X-ray reflectivity. In spite of several existing band structure calculations of the group III nitrides and previous optical studies in UV range, a direct probe of their conduction band densities of states is of interest. The authors performed a joint experimental and theoretical investigation using both of these experimental techniques for wurtzite GaN.

  16. Total reflection X-ray fluorescence as a tool for food screening

    NASA Astrophysics Data System (ADS)

    Borgese, Laura; Bilo, Fabjola; Dalipi, Rogerta; Bontempi, Elza; Depero, Laura E.

    2015-11-01

    This review provides a comprehensive overview of the applications of total reflection X-ray fluorescence (TXRF) in the field of food analysis. Elemental composition of food is of great importance, since food is the main source of essential, major and trace elements for animals and humans. Some potentially toxic elements, dangerous for human health may contaminate food, entering the food chain from the environment, processing, and storage. For this reason the elemental analysis of food is fundamental for safety assessment. Fast and sensitive analytical techniques, able to detect major and trace elements, are required as a result of the increasing demand on multi-elemental information and product screening. TXRF is suitable for elemental analysis of food, since it provides simultaneous multi-elemental identification in a wide dynamic range of concentrations. Several different matrices may be analyzed obtaining results with a good precision and accuracy. In this review, the most recent literature about the use of TXRF for the analysis of food is reported. The focus is placed on the applications within food quality monitoring of drinks, beverages, vegetables, fruits, cereals, animal derivatives and dietary supplements. Furthermore, this paper provides a critical outlook on the developments required to transfer these methods from research to the industrial and analytical laboratories contexts.

  17. Rainwater analysis by synchrotron radiation-total reflection X-ray fluorescence

    NASA Astrophysics Data System (ADS)

    López, María L.; Ceppi, Sergio A.; Asar, María L.; Bürgesser, Rodrigo E.; Ávila, Eldo E.

    2015-11-01

    Total reflection X-ray fluorescence analysis excited with synchrotron radiation was used to quantify the elemental concentration of rainwater in Córdoba, Argentina. Standard solutions with gallium as internal standard were prepared for the calibration curves. Rainwater samples of 5 μl were added to an acrylic reflector, allowed to dry, and analyzed for 200 s measuring time. The elemental concentrations of As, Ca, Co, Cr, Cu, Fe, K, Mn, Ni, Pb, S, Sr, V, and Zn were determined. The electrical conductivity, pH, and elemental concentrations were compared to data previously reported for the soluble fraction of rainwater at different sites. A factor analysis was performed in order to determine the sources that contributed to the elemental concentration in rainwater. Anthropogenic sources were identified as traffic pollution, vehicular emissions, and metallurgical factories. The quality of rainwater was analyzed by comparing the concentrations of all the elements in rainwater samples with the WHO guideline values for drinking water. The results show the need to control the atmospheric emissions in order to preserve the quality of rainwater. SR-TXRF analysis of chemical composition of rainwater in Córdoba represents the very first contribution in the region to the knowledge of the concentration of trace metals in the soluble fraction of rainwater. These data are scarce, especially in the Southern Hemisphere.

  18. X-ray reflectivity studies of liquid metal and alloy surfaces

    SciTech Connect

    Regan, M.J.; Pershan, P.S.; Magnussen, O.M.; Ocko, B.M.; Deutsch, M.; Berman, L.E.

    1997-06-01

    Surface-induced atomic layering at the liquid/vapor interface in liquid metals has been observed using x-ray reflectivity on sputtered clean surfaces under ultrahigh vacuum conditions. A well-defined quasi-Bragg peak is obtained for surfaces of elemental Ga and a Ga-In alloy at large wave vectors q{sub z}{approximately}2.3{endash}2.5 {Angstrom}{sup {minus}1}. These results are an unambiguous indication of atomic layering with an interlayer spacing d{approximately}2{pi}/q{sub z}=2.5{endash}2.7 {Angstrom}. For liquid Ga, the amplitude of the electron-density oscillations, which is significantly underestimated by existing theory and molecular simulation, decays with a characteristic length of 6 {Angstrom}, which is twice that of Hg. Results on the alloy show a clear enrichment of indium at the topmost surface layer, consistent with the Gibbs adsorption rule. The enrichment consists of a single monolayer, with subsequent layers at the bulk eutectic composition. In order to suppress mechanically excited surface waves, the measurements were performed on thin liquid metal films ({lt}0.5 mm deep), which leads to a macroscopically curved surface due to the large surface tensions in liquid metals. The experimental challenges posed by measurements on curved surfaces and the techniques that were developed are discussed in detail. {copyright} {ital 1997} {ital The American Physical Society}

  19. Determination of element levels in human serum: Total reflection X-ray fluorescence applications

    NASA Astrophysics Data System (ADS)

    Majewska, U.; Łyżwa, P.; Łyżwa, K.; Banaś, D.; Kubala-Kukuś, A.; Wudarczyk-Moćko, J.; Stabrawa, I.; Braziewicz, J.; Pajek, M.; Antczak, G.; Borkowska, B.; Góźdź, S.

    2016-08-01

    Deficiency or excess of elements could disrupt proper functioning of the human body and could lead to several disorders. Determination of their concentrations in different biological human fluids and tissues should become a routine practice in medical treatment. Therefore the knowledge about appropriate element concentrations in human organism is required. The purpose of this study was to determine the concentration of several elements (P, S, Cl, K, Ca, Cr, Fe, Cu, Zn, Se, Br, Rb, Pb) in human serum and to define the reference values of element concentration. Samples of serum were obtained from 105 normal presumably healthy volunteers (66 women aged between 15 and 78 years old; 39 men aged between 15 and 77 years old). Analysis has been done for the whole studied population and for subgroups by sex and age. It is probably first so a wide study of elemental composition of serum performed in the case of Świętokrzyskie region. Total reflection X-ray fluorescence (TXRF) method was used to perform the elemental analysis. Spectrometer S2 Picofox (Bruker AXS Microanalysis GmbH) was used to identify and measure elemental composition of serum samples. Finally, 1st and 3rd quartiles were accepted as minimum and maximum values of concentration reference range.

  20. Sub-nm accuracy metrology for ultra-precise reflective X-ray optics

    NASA Astrophysics Data System (ADS)

    Siewert, F.; Buchheim, J.; Zeschke, T.; Brenner, G.; Kapitzki, S.; Tiedtke, K.

    2011-04-01

    The transport and monochromatization of synchrotron light from a high brilliant laser-like source to the experimental station without significant loss of brilliance and coherence is a challenging task in X-ray optics and requires optical elements of utmost accuracy. These are wave-front preserving plane mirrors with lengths of up to 1 m characterized by residual slope errors in the range of 0.05 μrad (rms) and values of 0.1 nm (rms) for micro-roughness. In the case of focusing optical elements like elliptical cylinders the required residual slope error is in the range of 0.25 μrad rms and better. In addition the alignment of optical elements is a critical and beamline performance limiting topic. Thus the characterization of ultra-precise reflective optical elements for FEL-beamline application in the free and mounted states is of significant importance. We will discuss recent results in the field of metrology achieved at the BESSY-II Optics Laboratory (BOL) of the Helmholtz Zentrum Berlin (HZB) by use of the Nanometer Optical Component Measuring Machine (NOM). Different types of mirror have been inspected by line-scan and slope mapping in the free and mounted states. Based on these results the mirror clamping of a combined mirror/grating set-up for the BL-beamlines at FLASH was improved.

  1. Understanding properties of engineered catalyst supports using contact angle measurements and X-ray reflectivity.

    PubMed

    Amama, Placidus B; Islam, Ahmad E; Saber, Sammy M; Huffman, Daniel R; Maruyama, Benji

    2016-02-01

    There is significant interest in broadening the type of catalyst substrates that support the growth of high-quality carbon nanotube (CNT) carpets. In this study, ion beam bombardment has been utilized to modify catalyst substrates for CNT carpet growth. Using a combination of contact angle measurements (CAMs) and X-ray reflectivity (XRR) for the first time, new correlations between the physicochemical properties of pristine and engineered catalyst substrates and CNT growth behavior have been established. The engineered surfaces obtained after exposure to different degrees of ion beam damage have distinct physicochemical properties (porosity, layer thickness, and acid-base properties). The CAM data were analyzed using the van Oss-Chaudhury-Good model, enabling the determination of the acid-base properties of the substrate surfaces. For the XRR data, a Fourier analysis of the interference patterns enabled extraction of layer thickness, while the atomic density and interfacial roughness were extracted by analyzing the amplitude of the interference oscillations. The dramatic transformation of the substrate from "inactive" to "active" is attributed to a combined effect of substrate porosity or damage depth and Lewis basicity. The results reveal that the efficiency of catalyst substrates can be further improved by increasing the substrate basicity, if the minimum surface porosity is established. This study advances the use of a non-thermochemical approach for catalyst substrate engineering, as well as demonstrates the combined utility of CAM and XRR as a powerful, nondestructive, and reliable tool for rational catalyst design. PMID:26781333

  2. Surface structure of liquid Bi and Sn: An x-ray reflectivity study

    SciTech Connect

    Pershan, P.S.; Stoltz, S.E.; Shpyrko, Oleg G.; Deutsch, Moshe; Balagurusamy, V.S.K.; Meron, Mati; Lin, Binhua; Streitel, Reinhard

    2009-03-23

    X-ray reflectivity measurements of the liquid Bi surface are presented and analyzed together with previous liquid Sn results. Published measurements on liquid Ga, In, and K all exhibit a single strong maximum at a wave-vector transfer of the order of the reciprocal of an atomic-diameter, due to surface-induced layering. In contrast, both Sn and Bi exhibit - in addition - a weak broad peak at much smaller wave-vector transfers. This feature is an unambiguous signature of an enhanced electron density in the near-surface region. Possible ways of modeling this enhancement are presented. Once the different surface-roughening effects of thermal capillary waves are accounted for, the surface structure factors of Sn and Bi are remarkably similar. The principal difference between the two is that the depth of the layering below the surface is more than {approx}40% larger for Bi than for Sn. This is considerably larger than the ratio of their covalent radii which is only {approx}10%. No theoretical explanation can be offered at this time for the surface structure difference between Sn and Bi and other elemental liquid metals studied to date: Ga, In, and K.

  3. Characterization of Langmuir-Blodgett Organclay Films using X-ray Reflectivity and Atomic Fore Microscopy

    SciTech Connect

    Koo,J.; Park, S.; Satija, S.; Tikhonov, A.; Sokolov, J.; Rafailovich, M.; Koga, T.

    2008-01-01

    Monolayers of organoclay platelets were formed at the air/water interface using the Langmuir technique and were then investigated either by in situ or lifted onto Si wafers and studied ex situ, using X-ray reflectivity (XR) methods. The XR data showed that the surfactant molecules on the clay platelets formed a dense, self-assembled monolayer where the molecules were tilted at an angle of 35 {+-}6 from the normal to the dry clay surface. The surfactant layers only covered a fraction of the clay platelet surface area, where the fractional surface coverage for the three clays studied (C6A, C15A, and C20A) was found to be 0.90, 0.86, and 0.73, respectively. These values were significantly higher than those estimated from the cation exchange capacity (CEC) values. Rather than being uniformly distributed, the surfactant was clustered in patchy regions, indicating that the surface of the clay platelets had both polar and non-polar segments. This heterogeneity confirmed the hypothesis which was previously invoked to explain the distribution of the clay platelets in melt mixed homopolymer and polymer blend nanocomposites.

  4. Reflection nebulae in the Galactic center: soft X-ray imaging polarimetry

    NASA Astrophysics Data System (ADS)

    Marin, F.; Muleri, F.; Soffitta, P.; Karas, V.; Kunneriath, D.

    2015-04-01

    Context. The origin of irradiation and fluorescence of the 6.4 keV bright giant molecular clouds surrounding Sgr A∗, the central supermassive black hole of our Galaxy, remains enigmatic despite numerous attempts to decipher it with spectroscopic and timing analyses. Aims: Testing the theory of a past active period of Sgr A∗ requires opening a new observational window: X-ray polarimetry. In this paper, we aim to show how modern imaging polarimeters could revolutionize our understanding of the Galactic center (GC). Methods: Through Monte Carlo modeling, we produced a 4-8 keV polarization map of the GC. We focused on the polarimetric signature produced by Sgr B1, Sgr B2, G0.11-0.11, Bridge E, Bridge D, Bridge B2, MC2, MC1, Sgr C3, Sgr C2, and Sgr C1. We estimated the resulting polarization that arises from these scattering targets, included polarized flux dilution by the diffuse plasma emission detected toward the GC, and simulated the polarization map that modern polarimetric detectors would obtain assuming the performances of a mission prototype. Results: The eleven reflection nebulae we investigated present a variety of polarization signatures, ranging from nearly unpolarized to highly polarized (~77%) fluxes. Their polarization position angle is found to be normal to the scattering plane, as expected from previous studies. A major improvement in our simulation is the addition of a diffuse, unpolarized plasma emission that strongly affects soft X-ray polarized fluxes. The dilution factor is in the range 50%-70%, making the observation of the Bridge structure unlikely even in the context of modern polarimetry. The best targets are the Sgr B and Sgr C complexes and the G0.11-0.11 cloud, arranged in the order of decreasing detectability. Conclusions: An exploratory observation of a few hundred kilo-seconds of the Sgr B complex would allow a significant detection of the polarization and be sufficient to derive indications of the primary radiation source. A more

  5. Measurement of the effects of particulate contamination on X-ray reflectivity

    NASA Technical Reports Server (NTRS)

    Slane, P.; Mclaughlin, E. R.; Schwartz, D. A.; Van Speybroeck, L. P.; Bilbro, J. W.

    1989-01-01

    Because particles of sizes larger than a few tenths microns adversely affect high resolution X-ray telescopes by scattering and absorbing X-rays, the cleanliness required to maintain the about 1 percent overall calibration precision desired for the Advanced X-ray Astrophysics Facility (AXAF) is being investigated. At the grazing angles used for the AXAF mirrors, each particle shadows a surface area about 100 times its geometric area, necessitating glass occlusion specifications much more stringent than typically stipulated for visible-light particulate contamination. On test flats coated with gold, controlled levels of contamination have been deposited spanning the range from 5 x 10 to the -5th to 0.005 fractional area covered, and the absorption component of extinction has been measured over a range of grazing angles and X-ray energies to verify the predicted effects of particulate contamination.

  6. Resonant anomalous x-ray reflectivity as a probe of ion adsorption at solid-liquid interfaces.

    SciTech Connect

    Fenter, P.; Park, C.; Nagy, K. L.; Sturchio, N. C.; Chemistry; Univ. of Illinois at Chicago

    2007-05-23

    We discuss new opportunities to understand processes at the solid-liquid interface using resonant anomalous X-ray reflectivity (RAXR). This approach is illustrated by determination of element-specific density profiles at mica surfaces in aqueous electrolyte solutions containing Rb{sup +} and Sr{sup 2+}. The total interfacial electron density profile is determined by specular reflectivity (i.e., reflected intensity vs. momentum transfer, q, at an energy, E, far from any characteristic absorption edge). RAXR spectra (i.e., intensity vs. E at fixed q) reveal element-specific ion distributions. Key differences in the interaction of Rb{sup +} and Sr{sup 2+} with mica are observed using resonant anomalous X-ray reflectivity: Rb{sup +} adsorbs in a partially hydrated state, but Sr{sup 2+} adsorbs in both fully and partially hydrated states.

  7. Understanding properties of engineered catalyst supports using contact angle measurements and X-Ray reflectivity

    NASA Astrophysics Data System (ADS)

    Amama, Placidus B.; Islam, Ahmad E.; Saber, Sammy M.; Huffman, Daniel R.; Maruyama, Benji

    2016-01-01

    There is significant interest in broadening the type of catalyst substrates that support the growth of high-quality carbon nanotube (CNT) carpets. In this study, ion beam bombardment has been utilized to modify catalyst substrates for CNT carpet growth. Using a combination of contact angle measurements (CAMs) and X-ray reflectivity (XRR) for the first time, new correlations between the physicochemical properties of pristine and engineered catalyst substrates and CNT growth behavior have been established. The engineered surfaces obtained after exposure to different degrees of ion beam damage have distinct physicochemical properties (porosity, layer thickness, and acid-base properties). The CAM data were analyzed using the van Oss-Chaudhury-Good model, enabling the determination of the acid-base properties of the substrate surfaces. For the XRR data, a Fourier analysis of the interference patterns enabled extraction of layer thickness, while the atomic density and interfacial roughness were extracted by analyzing the amplitude of the interference oscillations. The dramatic transformation of the substrate from ``inactive'' to ``active'' is attributed to a combined effect of substrate porosity or damage depth and Lewis basicity. The results reveal that the efficiency of catalyst substrates can be further improved by increasing the substrate basicity, if the minimum surface porosity is established. This study advances the use of a non-thermochemical approach for catalyst substrate engineering, as well as demonstrates the combined utility of CAM and XRR as a powerful, nondestructive, and reliable tool for rational catalyst design.There is significant interest in broadening the type of catalyst substrates that support the growth of high-quality carbon nanotube (CNT) carpets. In this study, ion beam bombardment has been utilized to modify catalyst substrates for CNT carpet growth. Using a combination of contact angle measurements (CAMs) and X-ray reflectivity (XRR) for the

  8. Modeling Reflection Signatures in the RXTE Spectra from X-ray Binaries: The GX 339-4 Case

    NASA Astrophysics Data System (ADS)

    Garcia, Javier; McClintock, Jeffrey E.; Steiner, James F.; Remillard, Ronald A.; Grinberg, Victoria

    2014-08-01

    Despite its limited spectral resolution, the RXTE mission has provided a vast amount of observational data for many X-ray sources over its entire lifespan of 16 years. We have started a camping to analyze all the available data for most X-ray binaries, focusing on the detection and modeling of reflection signatures. We present the results of this camping on the analysis of all available data for GX 339-4 in the hard state. Strong reflection features such as the Fe K emission line, the Fe K-edge, and the Compton hump are clearly observed on a wide range of luminosities. By fitting the spectra with the most advanced relativistic reflection models we are to impose constrains on the ionization state of the gas, the inner radius of the accretion disk, and the inclination of the system. A novel technique to improve the quality of PCA spectral data will also be discussed.

  9. X-ray resonant scattering of (004n+2) forbidden reflections in spinel ferrites

    NASA Astrophysics Data System (ADS)

    Subías, G.; Garcia, J.; Proietti, M. G.; Blasco, J.; Renevier, H.; Hodeau, J. L.; Sánchez, M. C.

    2004-10-01

    The origin of the x-ray resonant scattering of (002) and (006) forbidden reflections in the spinel ferrites has been investigated. Resonant features were previously observed in Fe3O4 at the pre-edge and main-edge energies of the FeK -absorption edge. They were ascribed to dipole-quadrupole and dipole transitions at the tetrahedral and pseudo-octahedral Fe ions, respectively. To corroborate this origin and to differentiate between effects at the different metal sites, we have studied the energy and azimuthal dependencies of these reflections at the Fe, Co, and MnK edges in MnFe2O4 and CoFe2O4 spinels. Mn2+ mainly replaces Fe in the tetrahedral site whereas Co2+ occupies the octahedral site. No pre-edge peak is observed either at the FeK -edge in MnFe2O4 or at the CoK edge in CoFe2O4 . On the other hand, the peak at the absorption edge and the oscillations at energies beyond the edge are observed at the FeK edge in MnFe2O4 and CoFe2O4 and at the CoK edge in CoFe2O4 . Therefore, the pre-edge peak comes from the metal ions at the tetrahedral site while the main-edge peak arises from the metal ions at the pseudo-octahedral site of the spinel structure. The azimuthal dependence and the energy line shape confirm the dipole-quadrupole and dipole characters of these pre-edge and main-edge resonances, respectively. The energy-dependence spectra of Fe3O4 above and below the Néel temperature are alike, discarding any magnetic effect on the resonant spectra. Finally, the fine structure at energies beyond the absorption edge has been theoretically simulated considering only the local anisotropy of the dipolar atomic scattering factor of the pseudo-octahedral metal atom. These results demonstrate that (004n+2) resonant reflections arise from the anisotropy of the local structure around the transition-metal atom without contributions of charge or d -orbital ordering.

  10. Structural investigations of self-assembled monolayers for organic electronics: results from X-ray reflectivity.

    PubMed

    Khassanov, Artoem; Steinrück, Hans-Georg; Schmaltz, Thomas; Magerl, Andreas; Halik, Marcus

    2015-07-21

    Self-assembled monolayers (SAMs) have been established as crucial interlayers and electronically active layers in organic electronic devices, such as organic light emitting diodes (OLEDs), organic photovoltaics (OPVs), organic thin film transistors (OTFTs), and nonvolatile memories (NVMs). The use of self-assembling functionalized organic molecules is beneficial due to mainly three advantages compared with common thin film deposition approaches. (1) Molecular self-assembly occurs with surface selectivity, determined by the interaction between the functional anchor group of the organic molecules and the target surface. (2) The film thickness of the resulting layers is perfectly controllable on the angstrom scale, due to the self-terminating film formation to only a single molecular layer. And finally, (3) the wide variability in the chemical structure of such molecules enables different SAM functionalities for devices, ranging from electrical insulation to charge storage to charge transport. The SAM approach can be further expanded by employing several functionalized molecules to create mixed SAMs with consequently mixed properties. The function of SAMs in devices depends not only on the chemical structure of the molecules but also on their final arrangement and orientation on the surface. A reliable and nondestructive in-depth characterization of SAMs on nonconductive oxide surfaces is still challenging because of the very small thickness and the impracticality of methods such as scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). In this Account, we illustrate how X-ray reflectivity (XRR) provides analytical access to major questions of SAM composition, morphology, and even formation by means of investigations of pure and mixed SAMs based on phosphonic acids (PAs) of various chain structures on flat alumina (AlOx) surfaces. XRR is an analytical method that provides access to spatially averaged structural depth profiles over a relatively

  11. Area-selected Ion Milling for Reflection Wavefront Error Correction of Soft X-ray Multilayer Mirrors

    SciTech Connect

    Tsuru, Toshihide; Sakai, Yu; Hatano, Tadashi; Yamamoto, Masaki

    2010-06-23

    For accurate reflection wavefront error correction of imaging soft X-ray multilayer mirrors, a period-by-period ion milling system was developed. A stable and homogenized radial distribution of ion beam was realized for an ion milling over a whole area of 100 mm-wide multilayer. To demonstrate the wavefront error correction principle, a dielectric multilayer mirror for visible light was locally milled by our system. Wavefront as measured by a phase shifting interferometer showed the reflection phase of local milling multilayer advanced. Area-selected ion millings with mask templates made of Mo and Si, and by photoresist contact masks were carried out. Although striped patterns generated by the difference of spectroscopic reflectance between Mo and Si were observed at peripherals of milling area when templates were used, a clear and sharp edge pattern was obtained with contact mask. Soft X-ray reflectance of a Mo/Si multilayer milled with photoresist contact mask showed good feasibility of precise wavefront error correction of multilayers. These results proved our phase correction method is promising and practical for the 0.1 nm-period correction of soft X-ray multilayer mirror.

  12. Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors.

    PubMed

    Xu, Dechao; Huang, Qiushi; Wang, Yiwen; Li, Pin; Wen, Mingwu; Jonnard, Philippe; Giglia, Angelo; Kozhevnikov, Igor V; Wang, Kun; Zhang, Zhong; Wang, Zhanshan

    2015-12-28

    Pd/Y multilayer mirrors operating in the soft X-ray region are characterized by a high theoretical reflectance, reaching 65% at normal incidence in the 8-12 nm wavelength range. However, a severe intermixing of neighboring Pd and Y layers results in an almost total disappearance of the interfaces inside the multilayer structures fabricated by direct current magnetron sputtering and thus a dramatic reflectivity decrease. Based on grazing incidence X-ray reflectometry and X-ray photoelectron spectroscopy, we demonstrate that the stability of the interfaces in Pd/Y multilayer structures can be essentially improved by adding a small amount of nitrogen (4-8%) to the working gas (Ar). High resolution transmission electron microscopy shows that the interlayer width is only 0.9 nm and 0.6 nm for Y(N)-on-Pd(N) and Pd(N)-on-Y(N) interfaces, respectively. A well-defined crystalline texture of YN (200) is observed on the electron diffraction pattern. As a result, the measured reflectance of the Pd(N)/Y(N) multilayer achieves 30% at λ = 9.3 nm. The peak reflectivity value is limited by the remaining interlayers and the formation of the YN compound inside the yttrium layers, resulting in an increased absorption. PMID:26831970

  13. Combined in Situ X-ray absorption and diffuse reflectance infraredspectroscopy: An attractive tool for catalytic investigations

    SciTech Connect

    Marinkovic, N.S.; Ehrlich, S.; Wang, Q.; Barrio, L.; Khalid, S.; et.al.

    2010-11-24

    Catalysis investigations are often followed in a range of spectroscopic techniques. While diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) can be done on a bench-top instrument, X-ray absorption spectroscopy (XAS) techniques, such as extended X-ray absorption fine structure (EXAFS) and X-ray absorption near-edge structure (XANES) require synchrotron light. In order to ensure the same conditions during in situ catalysis for each method, a combined XAS/DRIFTS has been developed at beamline X18A at the National Synchrotron Light Source, Brookhaven National Laboratory. A rapid-scan FTIR spectrometer capable of both mid- and far-infrared measurements is equipped with an arm to redirect the IR beam outside the spectrometer. An in situ reaction chamber, equipped with glassy carbon windows for X-ray light and a KBr window for IR light passage is installed firmly on the arm. The reaction cell can be heated to 600 C and allows passage of gases through the catalyst so that both XAS and DRIFTS techniques can be done simultaneously in controlled environment conditions. Together with a fast-moving monochromator for quick-EXAFS and mass-spectrometric residual gas analysis, this new tool is a powerful method for testing catalytic reactions in real time.

  14. Revealing accretion on to black holes: X-ray reflection throughout three outbursts of GX 339-4

    NASA Astrophysics Data System (ADS)

    Plant, D. S.; Fender, R. P.; Ponti, G.; Muñoz-Darias, T.; Coriat, M.

    2014-08-01

    Understanding the dynamics behind black hole state transitions and the changes they reflect in outbursts has become long-standing problem. The X-ray reflection spectrum describes the interaction between the hard X-ray source (the power-law continuum) and the cool accretion disc it illuminates, and thus permits an indirect view of how the two evolve. We present a systematic analysis of the reflection spectrum throughout three outbursts (500+ observations) of the black hole binary GX 339-4, representing the largest study applying a self-consistent treatment of reflection to date. Particular attention is paid to the coincident evolution of the power law and reflection, which can be used to determine the accretion geometry. The hard state is found to be distinctly reflection weak; however, the ratio of reflection to power law gradually increases as the source luminosity rises. In contrast, the reflection is found to dominate the power law throughout most of the soft state, with increasing supremacy as the source decays. We discuss potential dynamics driving this, favouring inner disc truncation and decreasing coronal height for the hard and soft states, respectively. Evolution of the ionization parameter, power-law slope and high-energy cut-off also agree with this interpretation.

  15. Structural organization of liquid crystals at liquid crystal-air interface: Synchrotron X-ray reflectivity and computational simulations

    NASA Astrophysics Data System (ADS)

    Sadati, Monirosadat; Ramezani-Dakhel, Hadi; Bu, Wei; Sevgen, Emre; Liang, Zhu; Erol, Cem; Taheri Qazvini, Nader; Rahimi, Mohammad; Lin, Binhua; Roux, Benoit; Schlossman, Mark; de Pablo, Juan J.

    Numerous applications of liquid crystals (LC) rely on control of molecular orientation at an interface. However, little is known about the precise molecular structure of such interfaces. In this work, we have performed synchrotron X-ray reflectivity measurements accompanied by an advanced theoretical and computational analysis to study the structural organization of liquid crystals at the air-liquid crystal interface. The X-ray reflectivity was measured from two nematic (5CB) and smectic (8CB) liquid crystals at several temperatures, in the nematic phase and above the nematic-isotropic transition. Our computational simulations and X-ray reflectivity results indicate that in the case of 8CB nematic phase, incipient bulk smectic fluctuations are pinned at the interface to form temperature-dependent multilayers at the interface. Such layers can extend far from the interface. However, the interface of 5CB in the nematic phase exhibits a relatively small number of layers. These measurements will be extended to the study of the LC-aqueous electrolyte interfaces to understand the effects of electrostatic interactions and external stimuli on the interfacial anchoring energy and LC orientational ordering.

  16. X-ray Reflected Spectra from Accretion Disk Models. I. Constant Density Atmospheres

    NASA Technical Reports Server (NTRS)

    Garcia, Javier; Kallman, Timothy R.

    2009-01-01

    We present new models for illuminated accretion disks, their structure and reprocessed emission. We consider the effects of incident X-rays on the surface of an accretion disk by solving simultaneously the equations of radiative transfer, energy balance and ionization equilibrium over a large range of column densities. We assume plane-parallel geometry and azimuthal symmetry, such that each calculation corresponds to a ring at a given distance from the central object. Our models include recent and complete atomic data for K-shell of the iron and oxygen isonuclear sequences. We examine the effect on the spectrum of fluorescent Ka line emission and absorption in the emitted spectrum. We also explore the dependence of the spectrum on the strength of the incident X-rays and other input parameters, and discuss the importance of Comptonization on the emitted spectrum.

  17. Defect Cores Investigated by X-Ray Scattering close to Forbidden Reflections in Silicon

    SciTech Connect

    Richard, M.-I.; Holy, V.; Nordlund, K.

    2007-11-30

    A new x-ray scattering method is presented making possible the detection of defects and the investigation of the structure of their cores. The method uses diffuse x-ray scattering measured close to a forbidden diffraction peak, in which the intensity scattered from the distorted crystal lattice around the defects is minimized. As a first example of this nondestructive method we demonstrate how the local compression of the extra (111) double planes in extrinsic stacking faults in Si can be probed and quantified using a continuum approach for the simulation of the displacements. The results of the theory developed are found to be in very good agreement with atomistic simulations and experiments.

  18. X-RAY REFLECTED SPECTRA FROM ACCRETION DISK MODELS. I. CONSTANT DENSITY ATMOSPHERES

    SciTech Connect

    Garcia, J.; Kallman, T. R. E-mail: timothy.r.kallman@nasa.go

    2010-08-01

    We present new models for illuminated accretion disks, their structure, and reprocessed emission. We consider the effects of incident X-rays on the surface of an accretion disk by simultaneously solving the equations of radiative transfer, energy balance, and ionization equilibrium over a large range of column densities. We assume plane-parallel geometry and azimuthal symmetry, such that each calculation corresponds to a ring at a given distance from the central object. Our models include recent and complete atomic data for K-shell processes of the iron and oxygen isonuclear sequences. We examine the effect on the spectrum of fluorescent K{alpha} line emission and absorption in the emitted spectrum. We also explore the dependence of the spectrum on the strength of the incident X-rays and other input parameters, and discuss the importance of Comptonization on the emitted spectrum.

  19. Is SS 433 a misaligned ultraluminous X-ray source? Constraints from its reflected signal in the Galactic plane

    NASA Astrophysics Data System (ADS)

    Khabibullin, I.; Sazonov, S.

    2016-04-01

    We evaluate the emission that must arise due to reflection of the putative collimated X-ray radiation of SS 433 by atomic gas and molecular clouds in the Galactic plane and compare the predicted signal with existing RXTE and ASCA data for the region of interest. Assuming that the intrinsic X-ray spectrum of SS 433 is similar to that of ultraluminous X-ray sources (ULXs), we obtain an upper limit of ˜2 × 1039 erg s-1 on its total (angular-integrated) luminosity in the 2-10 keV energy band, which is only weakly dependent on the half-opening angle, Θr, of the emission cone. In contrast, the upper limit on the apparent luminosity of SS 433 (that would be perceived by an observer looking at its supercritical accretion disc face-on) decreases with increasing Θr and is ˜3 × 1040 erg s-1 for Θr ≳ Θp = 21°, where Θp is the precession angle of the baryonic jets (assuming that the emission cones precess in the same manner as the jets). This leaves open the possibility that SS 433 is a misaligned ULX. Further investigation of the reflection signal from the molecular clouds using higher angular resolution observations could improve these constraints with the potential to break the degeneracy between Θr and the apparent luminosity.

  20. Surface structure of the liquid Au[subscript 72]Ge[subscript 28] eutectic phase: X-ray reflectivity

    SciTech Connect

    Pershan, P.S.; Stoltz, S.E.; Mechler, S.; Shpyrko, O.G.; Grigoriev, A.Y.; Balagurusamy, V.S. K.; Lin, B.H.; Meron, M.

    2009-12-01

    The surface structure of the liquid phase of the Au{sub 72}Ge{sub 28} eutectic alloy has been measured using resonant and nonresonant x-ray reflectivity and grazing incidence x-ray diffraction. In spite of the significant differences in the surface tension of liquid Ge and Au the Gibbs adsorption enhancement of Ge concentration at the surface is minimal. This is in striking contrast to all the other binary alloys with large differences in the respective surface tensions measured up to date. In addition there is no evidence of the anomalous strong surface layering or in-plane crystalline order that has been reported for the otherwise quite similar liquid Au{sub 82}Si{sub 18} eutectic. Instead, the surface of eutectic Au{sub 72}Ge{sub 28} is liquidlike and the layering can be explained by the distorted crystal model with only slight modifications to the first layer.

  1. High-k dielectric characterization by VUV spectroscopic ellipsometry and X-ray reflection

    NASA Astrophysics Data System (ADS)

    Boher, P.; Evrard, P.; Piel, J. P.; Defranoux, C.; Fouere, J. C.; Bellandi, E.; Bender, H.

    2003-09-01

    In this study, we use vacuum UV spectroscopic ellipsometry (VUVSE) to characterize new high dielectric materials. Indeed, all the candidates for high k dielectrics become strongly absorbent when the wavelength is reduced down to 140nm. So, the correlation between thickness and refractive index is reduced in the VUV range and much more precise structural information can be deduced. HfO2, Al2O3 and mixed HfAlOx layers have been studied with and without thin SiO2 oxide at the interface. X-ray reflectometry (XRR) has been used to measure precisely the layer thickness and roughness. The two techniques are included in the same automated metrology system dedicated to 300mm technology which is also presented. We show in particular that VUVSE can detect the crystalline character of the layers and their composition can be measured in addition to the layer thickness. Results are compared to those obtained by transmission electron microscopy (TEM), x-ray fluorescence analysis (XRF) and x-ray photoemission (XPS).

  2. NUSTAR and SUZAKU X-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

    DOE PAGESBeta

    Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; Bauer, F.; Boggs, S. E.; Christensen, F. E.; Craig, W. W.; Dauser, T.; Elvis, M.; Fabian, A. C.; et al

    2015-06-15

    We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. As a result, we discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

  3. X-ray monochromator

    NASA Technical Reports Server (NTRS)

    Hoover, Richard B. (Inventor)

    1992-01-01

    An x-ray monochromator is described, wherin a housing supports a plurality of mirrors forming a plurality of opposed mirror faces in parallel with each other and having thereon multilayer coatings, with each of said pairs of mirror faces being provided with identical coatings which are different from the coatings on the other pairs of mirror faces such that each pair of mirror faces has a peak x-ray reflection at a different wavelength regime. The housing is moveable to bring into a polychromatic x-ray beam that pair of mirror faces having the best x-ray reflection for the desired wavelength, with the mirrors being pivotable to move the mirror faces to that angle of incidence at which the peak reflectivity of the desired wavelength x-rays occurs.

  4. Development of ion beam figuring system with electrostatic deflection for ultraprecise X-ray reflective optics

    SciTech Connect

    Yamada, Jumpei; Matsuyama, Satoshi Sano, Yasuhisa; Yamauchi, Kazuto

    2015-09-15

    We developed an ion beam figuring system that utilizes electrostatic deflection. The system can produce an arbitrary shape by deterministically scanning the ion beam. The scan of the ion beam, which can be precisely controlled using only an electrical signal, enables us to avoid degradation of the mirror shape caused by imperfect acceleration or deceleration of a mechanically scanning stage. Additionally, this surface figuring method can easily be combined with X-ray metrology because the workpiece remains fixed during the figuring. We evaluated the figuring accuracy of the system by fabricating a plano-elliptical mirror for X-ray focusing. A mirror with a shape error of 1.4 nm root mean square (RMS) with a maximum removal depth of 992 nm, which corresponds to figuring accuracy of 0.14% RMS, was achieved. After the second shape corrections, an elliptical shape with a shape error of approximately 1 nm peak-to-valley, 0.48 nm RMS could be fabricated. Then, the mirror surface was smoothed by a low-energy ion beam. Consequently, a micro-roughness of 0.117 nm RMS, measured by atomic force microscopy, was achieved over an area of 1 × 1 μm{sup 2}.

  5. Development of ion beam figuring system with electrostatic deflection for ultraprecise X-ray reflective optics

    NASA Astrophysics Data System (ADS)

    Yamada, Jumpei; Matsuyama, Satoshi; Sano, Yasuhisa; Yamauchi, Kazuto

    2015-09-01

    We developed an ion beam figuring system that utilizes electrostatic deflection. The system can produce an arbitrary shape by deterministically scanning the ion beam. The scan of the ion beam, which can be precisely controlled using only an electrical signal, enables us to avoid degradation of the mirror shape caused by imperfect acceleration or deceleration of a mechanically scanning stage. Additionally, this surface figuring method can easily be combined with X-ray metrology because the workpiece remains fixed during the figuring. We evaluated the figuring accuracy of the system by fabricating a plano-elliptical mirror for X-ray focusing. A mirror with a shape error of 1.4 nm root mean square (RMS) with a maximum removal depth of 992 nm, which corresponds to figuring accuracy of 0.14% RMS, was achieved. After the second shape corrections, an elliptical shape with a shape error of approximately 1 nm peak-to-valley, 0.48 nm RMS could be fabricated. Then, the mirror surface was smoothed by a low-energy ion beam. Consequently, a micro-roughness of 0.117 nm RMS, measured by atomic force microscopy, was achieved over an area of 1 × 1 μm2.

  6. Impulsive solar X-ray bursts. III - Polarization, directivity, and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

    NASA Technical Reports Server (NTRS)

    Langer, S. H.; Petrosian, V.

    1977-01-01

    The paper presents the spectrum, directivity, and state of polarization of the bremsstrahlung radiation expected from a beam of high-energy electrons spiraling along radial magnetic field lines toward the photosphere. A Monte Carlo method is then described for evaluation of the spectrum, directivity, and polarization of X-rays diffusely reflected from stellar photospheres. The accuracy of the technique is evaluated through comparison with analytic results. The calculated characteristics of the incident X-rays are used to evaluate the spectrum, directivity, and polarization of the reflected and total X-ray fluxes. The results are compared with observations.

  7. Structure and growth of stearate monolayers on calcite: First results of an in situ X-ray reflectivity study

    SciTech Connect

    Fenter, P.; Sturchio, N.C.

    1999-10-01

    The adsorption of organic molecules at mineral-fluid interfaces has a profound influence upon geochemical reaction and transport processes, yet little is known about the in situ structures or properties of organic layers at mineral-fluid interfaces. The authors describe an X-ray reflectivity study of stearate monolayers adsorbed at the calcite surface from methanolic solutions. Using these measurements the authors are able to determine important aspects of the in situ structure, bonding, adsorption, and growth mechanisms of stearate monolayers. The experimental approach demonstrated here can be applied widely in studying the interaction of organic molecules with mineral surfaces in aqueous systems.

  8. Elemental concentrations in skin of patients with fibroeptelial polip using synchrotron radiation total reflection x-ray fluorescence

    NASA Astrophysics Data System (ADS)

    Soares, Júlio C. A. C. R.; Anjos, Marcelino J.; Canellas, Catarine G. L.; Lopes, Ricardo T.

    2012-05-01

    In this work, the concentrations of trace elements were measured in acrochordon, a skin lesion also known as skin tag or fibroepithelial polyp, as well as in normal skin from the same patient. The samples were analyzed by Synchrotron Radiation Total Reflection X-ray Fluorescence (SRTXRF) in the Synchrotron Light National Laboratory (LNLS) in Campinas/São Paulo-Brazil. The collection of lesion and healthy skin samples, including papillary dermis and epidermis, has involved 17 patients. It was evaluated the presence of P, S, Cl, K, Ca, Fe, Cu and Zn in the paired samples, which were compared, and significant differences were found in some of them.

  9. Optical properties of zirconium carbide in 60-200 Å wavelength region using x-ray reflectivity technique.

    PubMed

    Singh, Amol; Modi, Mohammed H; Lodha, G S

    2015-01-10

    Optical constants of zirconium carbide (ZrC) have been determined in the soft x-ray region of 60-200 Å wavelength using angle-dependent x-ray reflectivity measurements. Reflectivity measurements are carried out at the reflectivity beamline of the Indus-1 synchrotron radiation source. Derived optical constants (δ and β) are compared with the tabulated values [At. Data Nucl. Data Tables 54, 181 (1993)]. The optical constants are 15%-35% lower than bulk values in the 60-200 Å wavelength region. Near the Zr M4 edge 187 eV (66.3 Å), the δ values were close to bulk values with a deviation of 5%-10%. A large deviation of ∼20% was found in beta values especially near the Zr M4 edge region, whereas it was in close agreement in the wavelength range away from the edge. To the best of our knowledge, this paper gives the first reported experimental values of optical constants for zirconium carbide in the 60-200 Å wavelength region. PMID:25967623

  10. REFLECTION-DOMINATED NUCLEAR X-RAY EMISSION IN THE EARLY-TYPE GALAXY ESO 565-G019

    SciTech Connect

    Gandhi, P.; Takahashi, T.; Terashima, Y.; Yamada, S.; Mushotzky, R. F.; Ueda, Y.; Baumgartner, W. H.; Malzac, J.; Vaghmare, K.

    2013-08-10

    We present the discovery of a reflection-dominated active galactic nucleus (AGN) in the early-type radio-quiet galaxy ESO 565-G019 with Suzaku and Swift/Burst Alert Telescope. The source X-ray spectrum below 10 keV is characteristic of other Compton-thick (CT) AGNs, clearly showing an inverted continuum and prodigious fluorescence iron emission above {approx}3 keV. A Compton shoulder to the neutral Fe K{alpha} line also appears to be present. There is evidence for long-term hard X-ray flux variability that we associate with changes in the intrinsic AGN power law. More of such reflection-dominated AGNs should be uncovered in the near future with the increased sensitivity of ongoing and new hard X-ray surveys. ESO 565-G019 is hosted in an early-type galaxy whose morphology has been variously classified as either type E or type S0. Only about 20 bona fide CT-AGNs have been identified in the local universe so far, and all exist in host galaxies with late Hubble types (S0 or later). CT columns of nuclear obscuring gas are uncommon in early-type galaxies in the local universe, so confirmation of the exact morphological class of ESO 565-G019 is important. Infrared photometry also shows the presence of large quantities of cool dust in the host, indicative of significant ongoing star formation. ESO 565-G019 may be the first identified local example of minor-merger-driven CT-AGN growth in an early-type host, or may be the result of interaction with its neighboring galaxy ESO 565-G018 in a wide pair.

  11. Rb+ adsorption at the quartz(101)-aqueous interface: comparison of resonant anomalous x-ray reflectivity with ab initio calculations

    DOE PAGESBeta

    Bellucci, Francesco; Lee, Sang Soo; Kubicki, James D.; Bandura, Andrei V.; Zhang, Zhan; Wesolowski, David J.; Fenter, Paul

    2015-01-29

    We study adsorption of Rb+ to the quartz(101)–aqueous interface at room temperature with specular X-ray reflectivity, resonant anomalous X-ray reflectivity, and density functional theory. The interfacial water structures observed in deionized water and 10 mM RbCl solution at pH 9.8 were similar, having a first water layer at height of 1.7 ± 0.1 Å above the quartz surface and a second layer at 4.8 ± 0.1 Å and 3.9 ± 0.8 Å for the water and RbCl solutions, respectively. The adsorbed Rb+ distribution is broad and consists of presumed inner-sphere (IS) and outer-sphere (OS) complexes at heights of 1.8 ±more » 0.1 and 6.4 ± 1.0 Å, respectively. Projector-augmented planewave density functional theory (DFT) calculations of potential configurations for neutral and negatively charged quartz(101) surfaces at pH 7 and 12, respectively, reveal a water structure in agreement with experimental results. These DFT calculations also show differences in adsorbed speciation of Rb+ between these two conditions. At pH 7, the lowest energy structure shows that Rb+ adsorbs dominantly as an IS complex, whereas at pH 12 IS and OS complexes have equivalent energies. The DFT results at pH 12 are generally consistent with the two site Rb distribution observed from the X-ray data at pH 9.8, albeit with some differences that are discussed. In conclusion, surface charge estimated on the basis of the measured total Rb+ coverage was -0.11 C/m2, in good agreement with the range of the surface charge magnitudes reported in the literature.« less

  12. X-ray beamsplitter

    DOEpatents

    Ceglio, Natale M.; Stearns, Daniel S.; Hawryluk, Andrew M.; Barbee, Jr., Troy W.

    1989-01-01

    An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5-50 pairs of alternate Mo/Si layers with a period of 20-250 A. The support membrane is 10-200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window.

  13. X-ray beamsplitter

    DOEpatents

    Ceglio, N.M.; Stearns, D.G.; Hawryluk, A.M.; Barbee, T.W. Jr.

    1987-08-07

    An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5--50 pairs of alternate Mo/Si layers with a period of 20--250 A. The support membrane is 10--200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window. 6 figs.

  14. X-Ray Reflection of Thermonuclear Bursts from Neutron Stars: Constraining Flames with RXTE and an Outlook on NICER

    NASA Astrophysics Data System (ADS)

    Keek, Laurens

    2016-04-01

    Thermonuclear X-ray bursts observed from accreting neutron stars are employed to study, e.g., the nuclear physics of rare isotopes and the dense matter equation of state. Recent observations indicate that bursts strongly affect their accretion environment, and reprocessed burst emission may reflect off the inner accretion disk. The spectra of the short (10-100s) bursts are, however, of insufficient quality to accurately separate the neutron star signal from accretion disk emission and burst reflection. Only for two rare "superbursts" with durations of several hours did RXTE/PCA spectra show burst reflection signatures. We discuss the case of 4U 1636-536, where the reflection signal traced the evolution of the ionization state of the inner disk. Our simulations show that a large reflection fraction may indicate that the disk puffs up due to burst irradiation. After separating the direct burst emission from reflection, we show that the rise of the superburst light curve is shaped by a stalling carbon flame. In the near future, the Neutron Star Interior Composition ExploreR (NICER) will have a band-pass that extends below 2 keV, where reflection dominates the burst spectrum, and which was not probed by RXTE. Therefore, NICER will be able to detect reflection features during the frequent short bursts. NICER will open a new field of studying the interaction of bursts and the accretion environment, which will inform us of which bursts are optimally suited for neutron star mass-radius measurements.

  15. Quantitative resonant soft x-ray reflectivity of ultrathin anisotropic organic layers: Simulation and experiment of PTCDA on Au

    NASA Astrophysics Data System (ADS)

    Capelli, R.; Mahne, N.; Koshmak, K.; Giglia, A.; Doyle, B. P.; Mukherjee, S.; Nannarone, S.; Pasquali, L.

    2016-07-01

    Resonant soft X-ray reflectivity at the carbon K edge, with linearly polarized light, was used to derive quantitative information of film morphology, molecular arrangement, and electronic orbital anisotropies of an ultrathin 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) film on Au(111). The experimental spectra were simulated by computing the propagation of the electromagnetic field in a trilayer system (vacuum/PTCDA/Au), where the organic film was treated as an anisotropic medium. Optical constants were derived from the calculated (through density functional theory) absorption cross sections of the single molecule along the three principal molecular axes. These were used to construct the dielectric tensor of the film, assuming the molecules to be lying flat with respect to the substrate and with a herringbone arrangement parallel to the substrate plane. Resonant soft X-ray reflectivity proved to be extremely sensitive to film thickness, down to the single molecular layer. The best agreement between simulation and experiment was found for a film of 1.6 nm, with flat laying configuration of the molecules. The high sensitivity to experimental geometries in terms of beam incidence and light polarization was also clarified through simulations. The optical anisotropies of the organic film were experimentally determined and through the comparison with calculations, it was possible to relate them to the orbital symmetry of the empty electronic states.

  16. Early stages in the high temperature cyclic oxidation of {beta}-NiAl: An x-ray reflectivity study

    SciTech Connect

    Muralidharan, G.; You, Hoydoo; Paulikas, A.P.; Veal, B.W.

    1996-12-31

    Early stages in the cyclic oxidation of {beta}-NiAl at 500{degrees}C, 600{degrees}C, 700{degrees}C and 800{degrees}C were investigated using the technique of x-ray reflectivity. By fitting the data to a model function, oxide layer thickness, roughness of the oxide-vapor interface, and the roughness of the oxide-substrate interface were obtained as a function of oxidation time and temperature of oxidation. The time dependence of the oxide thickness was observed to be logarithmic at lower temperatures (500{degrees}C and 600{degrees}C) while a conventional t{sup 0.5} kinetics was observed at the higher temperatures. Comparison of the roughness of the oxide-substrate interface with that of the oxide-vapor interface shows that for comparable oxide thicknesses and identical substrate conditions, the oxide-vapor interface was rougher than the oxide-substrate interface at all temperatures. This is consistent with the previously postulated growth mechanism (outward diffusion of cations) for oxide growth during the early stages of oxidation at these temperatures. Thus, x-ray reflectivity offers a convenient way of determining the oxide growth rates, and the roughness of the interfaces when the oxide layer is thin; this regime cannot be easily studied with the techniques that are currently used for oxidation studies.

  17. Static magnetic proximity effect in Pt /Ni1 -xFex bilayers investigated by x-ray resonant magnetic reflectivity

    NASA Astrophysics Data System (ADS)

    Klewe, C.; Kuschel, T.; Schmalhorst, J.-M.; Bertram, F.; Kuschel, O.; Wollschläger, J.; Strempfer, J.; Meinert, M.; Reiss, G.

    2016-06-01

    We present x-ray resonant magnetic reflectivity (XRMR) as a very sensitive tool to detect proximity induced interface spin polarization in Pt/FM heterostructures. Different XRMR experiments are carried out and the results are evaluated for their dependence on the magneto-optical depth profile, the photon energy, the optical parameters, and the ferromagnetic material. We demonstrate that a detailed analysis of the reflected x-ray intensity gives insight into the spatial distribution of the spin polarization of a nonmagnetic metal across the interface to a ferromagnetic layer. The evaluation of the experimental results with simulations based on optical data from ab initio calculations provides the induced magnetic moment per Pt atom in the spin-polarized volume adjacent to the ferromagnet. For a series with different ferromagnetic materials consisting of Pt/Fe, Pt/Ni33Fe67 , Pt/Ni81Fe19 (permalloy), and Pt/Ni bilayers we find the largest spin polarization in Pt/Fe and a much smaller magnetic proximity effect in Pt/Ni. Additional XRMR experiments with varying photon energy are in good agreement with the theoretical predictions for the energy dependence of the magneto-optical parameters and allow identifying the optical dispersion δ and absorption β across the Pt L3-absorption edge.

  18. Quantitative resonant soft x-ray reflectivity of ultrathin anisotropic organic layers: Simulation and experiment of PTCDA on Au.

    PubMed

    Capelli, R; Mahne, N; Koshmak, K; Giglia, A; Doyle, B P; Mukherjee, S; Nannarone, S; Pasquali, L

    2016-07-14

    Resonant soft X-ray reflectivity at the carbon K edge, with linearly polarized light, was used to derive quantitative information of film morphology, molecular arrangement, and electronic orbital anisotropies of an ultrathin 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) film on Au(111). The experimental spectra were simulated by computing the propagation of the electromagnetic field in a trilayer system (vacuum/PTCDA/Au), where the organic film was treated as an anisotropic medium. Optical constants were derived from the calculated (through density functional theory) absorption cross sections of the single molecule along the three principal molecular axes. These were used to construct the dielectric tensor of the film, assuming the molecules to be lying flat with respect to the substrate and with a herringbone arrangement parallel to the substrate plane. Resonant soft X-ray reflectivity proved to be extremely sensitive to film thickness, down to the single molecular layer. The best agreement between simulation and experiment was found for a film of 1.6 nm, with flat laying configuration of the molecules. The high sensitivity to experimental geometries in terms of beam incidence and light polarization was also clarified through simulations. The optical anisotropies of the organic film were experimentally determined and through the comparison with calculations, it was possible to relate them to the orbital symmetry of the empty electronic states. PMID:27421398

  19. Reflection grating spectrometer for the x-ray multi-mirror (XMM) space observatory: design and calculated performance

    SciTech Connect

    Hettrick, M.C.; Kahn, S.M.

    1985-10-01

    A spectrometer design candidate is presented for the X-ray Multi-Mirror (XMM) observatory, being planned by the European Space Agency (ESA) as a long-lived large-area of telescopes. The science requirement of moderate resolution (E/..delta..E approx.100) spectroscopy in a two octave region (0.5 to 2 keV) with extremely high throughput (effective area > 500 cm/sup 2/) results in the use of grazing incidence reflection gratings. Due to the low image quality of the telescopes (approx. 1 minute of arc), the grating dispersion must be maximized by use of the classical grating mount in which the spectrum is dispersed within the plane of incident radiation. Due to the small field of view by the x-ray telescopes, the gratings must be situated in the converging beam at the exit of the telescope. A spectrometer module consists of a thin-foil conical mirror telescope, a stack of plane varied-space reflection gratings and an imaging proportional counter. This system is analyzed on the basis of dispersion, geometric aberrations and efficiency. At a spectral resolution of 0.15 A, a twenty module XMM would attain an average effective area of approx.900 cm/sup 2/, reaching twice this value at the peak wavelength (15 A). Similar throughput is obtained in second order centered at 7.5 A, the two spectral orders separated by the non-dispersive energy resolution of the proportional counter. Continuous spectra are obtained in the 6-25 A band (0.5 to 2 keV), and can be extended to 45 A if desired by tuning of the grating. The instrument sensitivity is sufficient to allow the first spectral detection of soft x-ray features in external galaxies, with access to an estimated population of several hundred active galactic nuclei. Such observations will expand vastly the roles feasible for spectroscopy in x-ray astrophysics, marking the beginning of a new era in space astronomy.

  20. When is one layer complete? Using simultaneous in-situ RHEED and x-ray reflectivity to map layer-by-layer thin-film oxide growth

    NASA Astrophysics Data System (ADS)

    Sullivan, M. C.; Ward, M. J.; Joress, H.; Gutierrez-Llorente, A.; White, A. E.; Woll, A.; Brock, J. D.

    2014-03-01

    The most popular tool for characterizing in situ layer-by-layer growth is Reflection High-Energy Electron Diffraction (RHEED). X-ray reflectivity can also be used to study layer-by-layer growth, as long as the incident angle of the x-rays is far from a Bragg peak. During layer-by-layer homoepitaxial growth, both the RHEED intensity and the reflected x-ray intensity will oscillate, and each complete oscillation indicates the addition of one layer of material. However, it is well documented, but not well understood, that the maxima in the RHEED intensity oscillations do not necessarily occur at the completion of a layer. In contrast, the maxima in the x-ray intensity oscillations do occur at the completion of a layer, thus the RHEED and x-ray oscillations are rarely in phase. We present our results on simultaneous in situ x-ray reflectivity and RHEED during layer-by-layer growth of SrTiO3 and discuss how to determine the completion of a layer for RHEED oscillations independent of the phase of the RHEED oscillation. Supported by DOE Office of Basic Energy Sciences Award DE-SC0001086, CHESS is supported by the NSF & NIH/NIGMS via NSF award DMR-0936384.

  1. Small-Angle X-ray Scattering Study of Intramuscular Fish Bone: Collagen Fibril Superstructure Determined from Equidistant Meridional Reflections

    SciTech Connect

    Burger,C.; Zhou, H.; Sics, I.; Hsiao, B.; Chu, B.; Graham, L.; Glimcher, M.

    2008-01-01

    New insights into the bone collagen fibril superstructure have been obtained by novel small-angle X-ray scattering analysis. The analysis was carried out on the small-angle equidistant meridional reflections resulting from the periodic structure of collagen fibrils in their axial direction. Conventional two-dimensional analysis is difficult because of the large discrepancy of longitudinal and lateral length scales for individual fibrils, as well as their preferred orientation. The new approach represents an unapproximated analysis of the equidistant meridional reflections, which takes the exact separation of preferred orientation and fibril size effects into account. The analytical results (e.g. axial period, fibril diameter etc.) agree well with the parameters obtained from transmission electron microscopy.

  2. Total reflection X-ray fluorescence analysis of trace-elements in candies marketed in Mexico

    NASA Astrophysics Data System (ADS)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2010-06-01

    Trace metals concentrations in food are significant for nutrition, due either to their nature or toxicity. Sweets, including chewing gum and candies, are not exactly a food, but they usually are unwearied consumed by children, the most vulnerable age-group to any kind of metal contamination in the food chain. The presence of relatively high concentrations of heavy metals such as Lead elicits concern since children are highly susceptible to heavy metals poisoning. Trace-metals concentrations were determined for six different flavors of a Mexican candy by means of Total X-ray Fluorescence Spectrometry. Triplicate samples of the various candy's flavours (strawberry, pineapple, lemon, blackberry, orange and chilli) were digested in 8 mL of a mix of supra-pure HNO 3 and H 2O 2 (6 mL: 2 mL) in a microwave oven MARS-X. Results show the presence of essential and toxic elements such as Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Pb. All metal concentrations were higher and significantly different ( α = 0.05) in chilli candy, compared to other candy flavours. Lead concentration fluctuated in the range of 0.102 to 0.342 μg g - 1 . A discussion about risk consumption and concentration allowed by Mexican and International Norms is made. As a part of the Quality Control Program, a NIST standard of "Citrus Leaves" and a blank were treated in the same way.

  3. Center for X-Ray Optics, 1992

    SciTech Connect

    Not Available

    1993-08-01

    This report discusses the following topics: Center for X-Ray Optics; Soft X-Ray Imaging wit Zone Plate Lenses; Biological X-Ray microscopy; Extreme Ultraviolet Lithography for Nanoelectronic Pattern Transfer; Multilayer Reflective Optics; EUV/Soft X-ray Reflectometer; Photoemission Microscopy with Reflective Optics; Spectroscopy with Soft X-Rays; Hard X-Ray Microprobe; Coronary Angiography; and Atomic Scattering Factors.

  4. X-ray Crystallography Facility

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Edward Snell, a National Research Council research fellow at NASA's Marshall Space Flight Center (MSFC), prepares a protein crystal for analysis by x-ray crystallography as part of NASA's structural biology program. The small, individual crystals are bombarded with x-rays to produce diffraction patterns, a map of the intensity of the x-rays as they reflect through the crystal.

  5. X-ray magnetic circular dichroism and reflection anisotropy spectroscopy Kerr effect studies of capped magnetic nanowires

    SciTech Connect

    Cunniffe, J. P.; McNally, D.E.; Liberati, M.; Arenholz, E.; McGuinness, C.; McGilp, J. F.

    2010-03-02

    Aligned Co wires grown on Pt(997) under ultra-high vacuum conditions have been capped successfully by the epitaxial growth of Au monolayers (ML) at room temperature. The samples were kept under vacuum except when transferring between apparatus or when making some of the measurements. No degradation of the Co wires was detected during the measurements. The magneto-optic response of the system was measured using X-ray magnetic circular dichroism (XMCD) at the Co L{sub 2,3} edge and reflection anisotropy spectroscopy (RAS) at near normal incidence, which is sensitive to the normal component of the out-of-plane magnetization via the Kerr effect (MOKE). Capping the wires significantly impacts their magnetic properties. Comparison of the magneto-optic response of the system at X-ray and optical energies reveals small differences that are attributed to the induced moment in the Pt substrate and Au capping layer not picked up by the element specific XMCD measurements. The sensitivity of RAS-MOKE is sufficient to allow the determination of the easy axis direction of the capped wires to within a few degrees. The results for a 6-atom-wide Co wire sample, capped with 6 ML of Au, are consistent with the capped wires possessing perpendicular magnetization.

  6. Hard X-ray Spectroscopy and Imaging by a Reflection Zone Plate in the Presence of Astigmatism

    SciTech Connect

    Braig, Christoph; Lochel, Heike; Hafner, Aljosa; Firsov, Alexander; Rehanek, Jens; Brzhezinskaya, Maria; Wojcik, Michael; Macrander, Albert; Assoufid, Lahsen; Erko, Alexei

    2016-01-01

    The feasibility of an off-axis x-ray reflection zone plate to perform wavelength-dispersive spectroscopy, on-axis point focusing, and two-dimensional imaging is demonstrated by means of one and the same diffractive optical element (DOE) at a synchrotron radiation facility. The resolving power varies between 3×101 and 4×102 in the range of 7.6 keV to 9.0 keV, with its maximum at the design energy of 8.3 keV. This result is verified using an adjustable entrance slit, by which horizontal (H) and vertical (V) focusing to 0.85 μm(H) and 1.29 μm(V) is obtained near the sagittal focal plane of the astigmatic configuration. An angular and axial scan proves an accessible field of view of at least 0.6 arcmin × 0.8 arcmin and a focal depth of ±0.86 mm. Supported by the grating efficiency of around 17.5% and a very short pulse elongation, future precision x-ray fluorescence and absorption studies of transition metals at their K-edge on an ultrashort timescale could benefit from our findings.

  7. Inspection of the diamond-turned surfaces used for mounting an array of eight x-ray reflection gratings

    SciTech Connect

    Montesanti, R.C.

    1993-11-01

    This paper describes the use of a T-base diamond-turning machine as a measuring machine for inspecting the positional accuracy of the diamond-tuned surfaces of four attachment rails--parts that resemble precision step gauges. The attachment rails provide the precision mounting surfaces for a prototype array of eight X-ray reflection gratings for the European Space Agency`s (ESA) X-ray Multi-Mirror project (XMM). Each rail is 4.5 in. long with a cross-section of less than 0.1 in{sup 2}, and has eight protruding bosses spaced approximately 0.5 in. apart (Figure 1). A diamond-turned feature on each boss provides a mounting surface for one of the four corners of a grating. These surfaces are 0.018 in. high by 0.1 in. wide, and have a 12 in. cylindrical radius with an axis parallel to the boss protrusion (Figure 2). Together, the four rails provide eight sets of four coplanar points for mounting the gratings (Figure 3). Note that the gratings are not parallel to each other; they sweep through a 12 mrad angle from the first to eighth grating. To accommodate this fanned array, the normal directions (denoted by arrows in Figure 1) of the mounting surfaces on the bosses, at the rail centerline, also sweep through a 12 mrad angle from the first to eighth boss.

  8. Fabrication of the attachment rails used for mounting an array of eight x-ray reflection gratings

    SciTech Connect

    Montesanti, R.C.; Davis, P.J.

    1993-11-01

    This paper describes the fabrication of a set of four attachment rails-parts that resemble precision step gauges. The attachment rails provide the precision mounting surfaces for a prototype array of eight X-ray reflection gratings for the European Space Agency`s (ESA) X-ray Multi-Mirror project (XMM)Each rail is 4.5in. long with a cross-section of less than 0.1 in{sup 2}, and has eight protruding bosses spaced approximately 0.5in. apart (Figure 1). A diamond-turned feature on each boss provides a mounting surface for one of the four corners of a grating. These surfaces are 0.018in. high by 0.1in. wide, and have a 12in. cylindrical radius with an axis parallel to the boss protrusion (Figure 2). Together, the four rails provide eight sets of four coplanar points for mounting the gratings (Figure 3). Note that the gratings are not parallel to each other; they sweep through a 12 mrad angle from the first to eighth grating. To accommodate this fanned array, the normal directions (denoted by arrows in Figure 1) of the mounting surfaces on the bosses, at the rail centerline, also sweep through a 12 mrad angle from the first to eighth boss.

  9. Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism.

    PubMed

    Braig, Christoph; Löchel, Heike; Firsov, Alexander; Brzhezinskaya, Maria; Hafner, Aljosa; Rehanek, Jens; Wojcik, Michael; Macrander, Albert; Assoufid, Lahsen; Erko, Alexei

    2016-01-01

    The feasibility of an off-axis x-ray reflection zone plate to perform wavelength-dispersive spectroscopy, on-axis point focusing, and two-dimensional imaging is demonstrated by means of one and the same diffractive optical element (DOE) at a synchrotron radiation facility. The resolving power varies between 3×101 and 4×102 in the range of 7.6 keV to 9.0 keV, with its maximum at the design energy of 8.3 keV. This result is verified using an adjustable entrance slit, by which horizontal (H) and vertical (V) focusing to 0.85 μm(H) and 1.29 μm(V) is obtained near the sagittal focal plane of the astigmatic configuration. An angular and axial scan proves an accessible field of view of at least 0.6 arcmin × 0.8 arcmin and a focal depth of ±0.86  mm. Supported by the grating efficiency of around 17.5% and a very short pulse elongation, future precision x-ray fluorescence and absorption studies of transition metals at their K-edge on an ultrashort timescale could benefit from our findings. PMID:26696150

  10. Analytical performance of benchtop total reflection X-ray fluorescence instrumentation for multielemental analysis of wine samples

    NASA Astrophysics Data System (ADS)

    Dalipi, Rogerta; Marguí, Eva; Borgese, Laura; Bilo, Fabjola; Depero, Laura E.

    2016-06-01

    Recent technological improvements have led to a widespread adoption of benchtop total reflection X-ray fluorescence systems (TXRF) for analysis of liquid samples. However, benchtop TXRF systems usually present limited sensitivity compared with high-scale instrumentation which can restrict its application in some fields. The aim of the present work was to evaluate and compare the analytical capabilities of two TXRF systems, equipped with low power Mo and W target X-ray tubes, for multielemental analysis of wine samples. Using the Mo-TXRF system, the detection limits for most elements were one order of magnitude lower than those attained using the W-TXRF system. For the detection of high Z elements like Cd and Ag, however, W-TXRF remains a very good option due to the possibility of K-Lines detection. Accuracy and precision of the obtained results have been evaluated analyzing spiked real wine samples and comparing the TXRF results with those obtained by inductively coupled plasma emission spectroscopy (ICP-OES). In general, good agreement was obtained between ICP-OES and TXRF results for the analysis of both red and white wine samples except for light elements (i.e., K) which TXRF concentrations were underestimated. However, a further achievement of analytical quality of TXRF results can be achieved if wine analysis is performed after dilution of the sample with de-ionized water.

  11. High Resolution X-Ray Spectroscopy of zeta Puppis with the XMM-Newton Reflection Grating Spectrometer

    NASA Technical Reports Server (NTRS)

    Kahn, S. M.; Leutenegger, M. A.; Cottam, J.; Rauw, G.; Vreux, J.-M.; denBoggende, A. J. F.; Mewe, R.; Guedel, M.

    2000-01-01

    We present the first high resolution X-ray spectrum of the bright O4Ief supergiant star Puppis, obtained with the Reflection Grating Spectrometer on- board XMM-Newton. The spectrum exhibits bright emission lines of hydrogen-like and helium-like ions of nitrogen, oxygen, neon, magnesium, and silicon, as well as neon-like ions of iron. The lines are all significantly resolved, with characteristic velocity widths of order 1000 - 1500 km/ s. The nitrogen lines are especially strong, and indicate that the shocked gas in the wind is mixed with CNO-burned material, as has been previously inferred for the atmosphere of this star from ultraviolet spectra. We find that the forbidden to intercombination line ratios within the helium-like triplets are anomalously low for N VI, O VII, and Ne IX. While this is sometimes indicative of high electron density, we show that in this case, it is instead caused by the intense ultraviolet radiation field of the star. We use this interpretation to derive constraints on the location of the X-ray emitting shocks within the wind that agree remarkably well with current theoretical models for this system.

  12. Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals.

    PubMed

    Sakurai, Kenji; Eba, Hiromi; Inoue, Katsuaki; Yagi, Naoto

    2002-09-01

    The present paper reports significant enhancement of the detection power for total-reflection X-ray fluorescence (TXRF). The employment of an efficient wavelength-dispersive spectrometer rather than a conventional Si(Li) detector, as well as the use of a quasi-monochromatic undulator X-ray source, completely changed the quality of X-ray florescence spectra. The energy resolution is 20 times better, which effectively contributes to reducing the low-energy tail of the scattering background and to separating neighboring X-ray florescence peaks. Another advantage is its capability with respect to high-counting-rate measurements, which ensure the detection of weak signals from trace materials. The absolute and relative detection limit for nickel are 3.1 x 10(-16) g and 3.1 ppt (pg/g) for a 0.1-microL droplet of pure water, respectively, which is nearly 50 times better than the current best data achieved by conventional energy-dispersive TXRF using a Si(Li) detector system. PMID:12236366

  13. X-ray reflection efficiency of nickel-coated quartz optical flats

    NASA Technical Reports Server (NTRS)

    Reynolds, J. M.; Fields, S. A.; Wilson, R. M.

    1973-01-01

    The reflection efficiency of quartz optical flats vacuum coated with 1000-A nickel was evaluated. Of the three vacuum coated samples tested, two had been contaminated during the firing of the Lunar Module Reaction Control System in the vacuum chamber. Measurements were made for 1.54-, 1.79-, and 2.29-A incident radiation. The reflection efficiency of the contaminated samples was reduced by as much as 50 percent for some angles of incidence.

  14. X-RAYING AN ACCRETION DISK IN REALTIME: THE EVOLUTION OF IONIZED REFLECTION DURING A SUPERBURST FROM 4U 1636-536

    SciTech Connect

    Keek, L.; Ballantyne, D. R.; Kuulkers, E.; Strohmayer, T. E.

    2014-12-20

    When a thermonuclear X-ray burst ignites on an accreting neutron star, the accretion disk undergoes sudden strong X-ray illumination, which can drive a range of processes in the disk. Observations of superbursts, with durations of several hours, provide the best opportunity to study these processes and to probe accretion physics. Using detailed models of X-ray reflection, we perform time resolved spectroscopy of the superburst observed from 4U 1636-536 in 2001 with the Rossi X-Ray Timing Explorer. The spectra are consistent with a blackbody reflecting off a photoionized accretion disk, with the ionization state dropping with time. The evolution of the reflection fraction indicates that the initial reflection occurs from a part of the disk at larger radius, subsequently transitioning to reflection from an inner region of the disk. Even though this superburst did not reach the Eddington limit, we find that a strong local absorber develops during the superburst. Including this event, only two superbursts have been observed by an instrument with sufficient collecting area to allow for this analysis. It highlights the exciting opportunity for future X-ray observatories to investigate the processes in accretion disks when illuminated by superbursts.

  15. α-Synuclein insertion into supported lipid bilayers as seen by in situ X-ray reflectivity.

    PubMed

    Hähl, Hendrik; Möller, Isabelle; Kiesel, Irena; Campioni, Silvia; Riek, Roland; Verdes, Dorinel; Seeger, Stefan

    2015-03-18

    Large aggregates of misfolded α-synuclein inside neuronal cells are the hallmarks of Parkinson's disease. The protein's natural function and its supposed toxicity, however, are believed to be closely related to its interaction with cell and vesicle membranes. Upon this interaction, the protein folds into an α-helical structure and intercalates into the membrane. In this study, we focus on the changes in the lipid bilayer caused by this intrusion. In situ X-ray reflectivity was applied to determine the vertical density structure of the bilayer before and after exposure to α-synuclein. It was found that the α-synuclein insertion, wild type and E57K variant, caused a reduction in bilayer thickness. This effect may be one factor in the membrane pore formation ability of α-synuclein. PMID:25523270

  16. Total reflection x-ray fluorescence spectroscopy as a tool for evaluation of iron concentration in ferrofluids and yeast samples

    NASA Astrophysics Data System (ADS)

    Kulesh, N. A.; Novoselova, I. P.; Safronov, A. P.; Beketov, I. V.; Samatov, O. M.; Kurlyandskaya, G. V.; Morozova, M.; Denisova, T. P.

    2016-10-01

    In this study, total reflection x-ray fluorescent (TXRF) spectrometry was applied for the evaluation of iron concentration in ferrofluids and biological samples containing iron oxide magnetic nanoparticles obtained by the laser target evaporation technique. Suspensions of maghemite nanoparticles of different concentrations were used to estimate the limitation of the method for the evaluation of nanoparticle concentration in the range of 1-5000 ppm in absence of organic matrix. Samples of single-cell yeasts grown in the nutrient media containing maghemite nanoparticles were used to study the nanoparticle absorption mechanism. The obtained results were analyzed in terms of applicability of TXRF for quantitative analysis in a wide range of iron oxide nanoparticle concentrations for biological samples and ferrofluids with a simple established protocol of specimen preparation.

  17. Determination of copper, iron and zinc in spirituous beverages by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Capote, T.; Marcó, L. M.; Alvarado, J.; Greaves, E. D.

    1999-10-01

    The concentration of copper in traditional homemade alcoholic distillates produced in Venezuela (Cocuy de Penca) were determined by total reflection X-ray fluorescence (TXRF) using vanadium as internal standard. The results were compared to those obtained by flame atomic absorption spectrometry (FAAS). Three preparative methods of addition of vanadium were compared: classical internal standard addition, 'layer on layer' internal standard addition and in situ addition of internal standard. The TXRF procedures were accurate and the precision was comparable to that obtained by the FAAS technique. Copper levels were above the maximum allowed limits for similar beverages. Zinc and iron in commercial and homemade distilled beverages were also analyzed by TXRF with in situ addition of internal standard demonstrating the usefulness of this technique for trace metal determination in distillates.

  18. Use of total-reflection X-ray fluorescence in search of a biomonitor for environmental pollution in Vietnam

    NASA Astrophysics Data System (ADS)

    Brauer, Hans; Wagner, Annemarie; Boman, Johan; Viet Binh, Doan

    2001-11-01

    The concentration of trace elements in tissues of several animals collected in the Ha Nam province, approximately 40 km south of Hanoi, Vietnam, has been investigated using total-reflection X-ray fluorescence analysis. We find that the freshwater mussel is probably the optimal choice of biomonitor for the pollution situation in Vietnam, but the freshwater crab, the toad and the catfish are also good candidates. The krait is probably also well suited for this purpose. It is shown that since several elements show a more or less pronounced accumulation tendency in a particular tissue it can be of great use to determine the levels in different tissues. When selecting an organism to be used as a biomonitor, other factors besides the mere concentration of trace elements must be considered, for instance the abundance and feeding habits.

  19. Seasonal variation in trace and minor elements in Brazilian honey by total reflection X-ray fluorescence.

    PubMed

    de Oliveira Resende Ribeiro, Roberta; Mársico, Eliane Teixeira; da Silva Carneiro, Carla; Simoes, Julia Siqueira; da Silva Ferreira, Micheli; de Jesus, Edgar Francisco Oliveira; Almeida, Eduardo; Junior, Carlos Adam Conte

    2015-03-01

    Honey is used as an alternative medicine and is a constituent of a healthy diet worldwide. Its composition is associated with botanical origin and, to some extent, geographical origin because soil and climate characteristics determine the melliferous flora. Also, the elements content in honey samples could give an indication of environmental pollution or geographical origin. The main purpose of this study was to evaluate seasonal patterns of essential elements of Brazilian honey. Honey was collected during spring, summer, autumn, and winter for 2 years to quantify K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Se, Br, and Sr using total reflection X-ray fluorescence spectroscopy (TXRF). Our results indicate no seasonal differences in concentration of Cr, Ni, Se, and Ti, although there were significant seasonal patterns in the composition of essential elements in honey, with higher concentrations of minor and trace elements, especially K and Ca of samples collected in spring and summer. PMID:25663399

  20. High angular resolution slope measuring deflectometry for the characterization of ultra-precise reflective x-ray optics

    NASA Astrophysics Data System (ADS)

    Siewert, F.; Buchheim, J.; Höft, T.; Fiedler, S.; Bourenkov, G.; Cianci, M.; Signorato, R.

    2012-07-01

    Slope measuring deflectometry has become a standard technique for inspection of ultra-precise reflective optical elements of synchrotron applications. We will report on the inspection of ultra-precise adaptive synchrotron mirrors (bimorph mirrors) to be used under grazing incidence condition. The measurements were performed at the BESSY-II Optics Laboratory of the Helmholtz Zentrum Berlin using the nanometer optical component measuring machine (NOM). Based on the data obtained by the optical measurements, we in this paper simulate the characteristics of the achievable x-ray focus by ray tracing calculations, demonstrated in the case of bimorph mirrors of the EMBL MX1 beamline for macromolecular crystallography at DESY's synchrotron radiation source PETRA III in Hamburg.

  1. Diffusion of Ag into organic semiconducting materials: a combined analytical study using transmission electron microscopy and X-ray reflectivity.

    PubMed

    Fladischer, Stefanie; Neuhold, Alfred; Kraker, Elke; Haber, Thomas; Lamprecht, Bernhard; Salzmann, Ingo; Resel, Roland; Grogger, Werner

    2012-10-24

    This study shows that the morphology of organic/metal interfaces strongly depends on process parameters and the involved materials. The interface between organic n-type blocking layer materials and the top Ag cathode within an organic photodiode was investigated. Ag was deposited on either amorphous tris-8-hydroxyquinolinato-aluminum (Alq(3)) or crystalline 4,7-diphenyl-1,10-phenanthroline (Bphen) using different deposition techniques such as electron beam deposition, ion beam sputtering, and vacuum thermal evaporation at various deposition rates. The interfaces were studied by transmission electron microscopy and X-ray reflectivity. It was found that Bphen does not show any Ag diffusion no matter which deposition technique was used, whereas the Ag diffusion into Alq(3) depends on the deposition technique and the deposition rate. The highest amount of Ag diffusion into Alq(3) occurred by using thermal vacuum deposition at low deposition rates. PMID:23027799

  2. Barrier performance optimization of atomic layer deposited diffusion barriers for organic light emitting diodes using x-ray reflectivity investigations

    SciTech Connect

    Singh, Aarti Schröder, Uwe; Klumbies, Hannes; Müller-Meskamp, Lars; Leo, Karl; Geidel, Marion; Knaut, Martin; Hoßbach, Christoph; Albert, Matthias; Mikolajick, Thomas

    2013-12-02

    The importance of O{sub 3} pulse duration for encapsulation of organic light emitting diodes (OLEDs) with ultra thin inorganic atomic layer deposited Al{sub 2}O{sub 3} layers is demonstrated for deposition temperatures of 50 °C. X-ray reflectivity (XRR) measurements show that O{sub 3} pulse durations longer than 15 s produce dense and thin Al{sub 2}O{sub 3} layers. Correspondingly, black spot growth is not observed in OLEDs encapsulated with such layers during 91 days of aging under ambient conditions. This implies that XRR can be used as a tool for process optimization of OLED encapsulation layers leading to devices with long lifetimes.

  3. X-ray View of Four High-Luminosity Swift-BAT AGN: Unveiling Obscuration and Reflection with Suzaku

    NASA Technical Reports Server (NTRS)

    Fiorettil, V.; Angelini, L.; Mushotzky, R. F.; Koss, M.; Malaguti, G.

    2013-01-01

    Aims. A complete census of obscured Active Galactic Nuclei (AGN) is necessary to reveal the history of the super massive black hole (SMBH) growth and galaxy evolution in the Universe given the complex feedback processes and the fact that much of this growth occurs in an obscured phase. In this context, hard X-ray surveys and dedicated follow-up observations represent a unique tool for selecting highly absorbed AGN and for characterizing the obscuring matter surrounding the SMBH. Here we focus on the absorption and reflection occurring in highly luminous, quasar-like AGN, to study the relation between the geometry of the absorbing matter and the AGN nature (e.g. X-ray, optical, and radio properties), and to help to determine the column density dependency on the AGN luminosity. Methods. The Swift/BAT nine-month survey observed 153 AGN, all with ultra-hard X-ray BAT fluxes in excess of 10(exp -11) erg per square centimeter and an average redshift of 0.03. Among them, four of the most luminous BAT AGN (44.73 less than LogLBAT less than 45.31) were selected as targets of Suzaku follow-up observations: J2246.0+3941 (3C 452), J0407.4+0339 (3C 105), J0318.7+6828, and J0918.5+0425. The column density, scattered/reflected emission, the properties of the Fe K line, and a possible variability are fully analyzed. For the latter, the spectral properties from Chandra, XMM-Newton and Swift/XRT public observations were compared with the present Suzaku analysis, adding an original spectral analysis when non was available from the literature. Results. Of our sample, 3C 452 is the only certain Compton-thick AGN candidate because of i) the high absorption (N(sub H) approximately 4 × 10(exp 23) per square centimeter) and strong Compton reflection; ii) the lack of variability; iii) the "buried" nature, i.e. the low scattering fraction (less than 0.5%) and the extremely low relative [OIII] luminosity. In contrast 3C 105 is not reflection-dominated, despite the comparable column density

  4. An examination of black hole binaries using X-ray observations and the development of the Bragg reflection polarimeter

    NASA Astrophysics Data System (ADS)

    Allured, Ryan

    Black hole binaries (BHBs) consist of a black hole which accretes matter from a companion star and emits radiation primarily in the X-ray band. They are known to evolve through various states of emission, which are believed to signify changes in the accretion geometry. MAXI J1659--152 is a recently discovered galactic BHB, and we used Rossi X-ray Timing Explorer (RXTE) observations to investigate its state evolution during its 2010 outburst. This evolution was found to be similar to that of other known BHBs, although its thermal spectral component was relatively weak. The data was also used to estimate the black hole mass to be 3.6--8.0 solar masses. Archival RXTE and Swift data were used to examine another BHB known as GX 339--4 in its faint, hard emission state. This source has a persistent iron line in its spectrum throughout its various emission states, and it is frequently used to estimate the inner radius of its accretion disk. The data were unable to constrain the inner radius through the modeling of the iron line, but estimates based on modeling of the thermal spectral component proved to be consistent with an increase in inner radius at low luminosities. Theoretical predictions of the soft X-ray polarization of BHBs indicate a change in both angle and magnitude with energy. The details of this change depend on both the spin and mass of the black hole. The NASA Gravity and Extreme Magnetism Small Explorer (GEMS) mission sought to use this effect to measure the spin of BHBs, which is necessary to develop tests of the Kerr metric in general relativity. The Bragg Reflection Polarimeter (BRP) was the student experiment on this mission, and was in the beginning stages of flight fabrication at the time of the mission's cancellation in May 2012. A prototype multilayer reflector meeting nearly all requirements was developed and its performance measured at a synchrotron beamline. Monte-Carlo simulations were carried out to estimate the ultimate polarization

  5. X-ray off-specular reflectivity studies of electrochemical pitting of Cu surfaces in sodium bicarbonate solution.

    SciTech Connect

    Feng, Y. P.; Sinha, S. K.; Melendres, C. A.; Lee, D. D.; Chemical Engineering; Exxon Research and Engineering Co.; Massachusetts Inst. of Tech.

    1996-01-01

    We have studied the electrochemically-induced pitting process on a Cu electrode in NaHCO{sub 3} solution using in-situ X-ray off-specular reflectivity measurements. The morphology and growth dynamics of the localized corrosion sites or pits were studied as the applied potential was varied from the cathodic region where the Cu surface is relatively free of oxide films to the anodic region where surface roughening occurs by general corrosion with concomitant formation of an oxide film. Quantitative analysis of the experimental results indicates that early pitting proceeds in favor of nucleation of pit clusters over individual pit growth. It was found that the lateral distribution of the pits is not random but exhibits a short-range order as evidenced by the appearance of a side peak in the transverse off-specular reflectivity. The position, height, and width of the peak was modeled to yield the average size, nearest-neighbor distance (within any one of the clusters), and over-all density of the pits averaged over the entire illuminated surface. In addition, measurements of the longitudinal off-specular reflectivity indicate a bimodal depth distribution for the pits, suggesting a 'film breaking' type of pitting mechanism.

  6. Analysis of low Z elements in various environmental samples with total reflection X-ray fluorescence (TXRF) spectrometry

    NASA Astrophysics Data System (ADS)

    Hoefler, H.; Streli, C.; Wobrauschek, P.; Óvári, M.; Záray, Gy.

    2006-11-01

    Recently there is a growing interest in low Z elements such as carbon, oxygen up to sulphur and phosphorus in biological specimen. Total reflection X-ray fluorescence (TXRF) spectrometry is a suitable technique demanding only very small amounts of sample. On the other side, the detection of low Z elements is a critical point of this analytical technique. Besides other effects, self absorption may occur in the samples, because of the low energy of the fluorescence radiation. The calibration curves might be not linear any longer. To investigate this issue water samples and samples from human cerebrospinal fluid were used to examine absorption effects. The linearity of calibration curves in dependence of sample mass was investigated to verify the validity of the thin film approximation. The special requirements to the experimental setup for low Z energy dispersive fluorescence analysis were met by using the Atominstitute's TXRF vacuum chamber. This spectrometer is equipped with a Cr-anode X-ray tube, a multilayer monochromator and a SiLi detector with 30 mm 2 active area and with an ultrathin entrance window. Other object on this study are biofilms, living on all subaqueous surfaces, consisting of bacteria, algae and fungi embedded in their extracellular polymeric substances (EPS). Many trace elements from the water are bound in the biofilm. Thus, the biofilm is a useful indicator for polluting elements. For biomonitoring purposes not only the polluting elements but also the formation and growth rate of the biofilm are important. Biofilms were directly grown on TXRF reflectors. Their major elements and C-masses correlated to the cultivation time were investigated. These measured masses were related to the area seen by the detector, which was experimentally determined. Homogeneity of the biofilms was checked by measuring various sample positions on the reflectors.

  7. JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants

    NASA Astrophysics Data System (ADS)

    Ingerle, D.; Pepponi, G.; Meirer, F.; Wobrauschek, P.; Streli, C.

    2016-04-01

    Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool making use of the phenomenon of total external reflection of X-rays on smooth polished surfaces. In recent years the method experienced a revival, being a powerful tool for process analysis and control in the fabrication of semiconductor based devices. Due to the downscaling of the process size for semiconductor devices, junction depths as well as layer thicknesses are reduced to a few nanometers, i.e. the length scale where GIXRF is highly sensitive. GIXRF measures the X-ray fluorescence induced by an X-ray beam incident under varying grazing angles and results in angle dependent intensity curves. These curves are correlated to the layer thickness, depth distribution and mass density of the elements in the sample. But the evaluation of these measurements is ambiguous with regard to the exact distribution function for the implants as well as for the thickness and density of nanometer-thin layers. In order to overcome this ambiguity, GIXRF can be combined with X-ray reflectometry (XRR). This is straightforward, as both techniques use similar measurement procedures and the same fundamental physical principles can be used for a combined data evaluation strategy. Such a combined analysis removes ambiguities in the determined physical properties of the studied sample and, being a correlative spectroscopic method, also significantly reduces experimental uncertainties of the individual techniques. In this paper we report our approach to a correlative data analysis, based on a concurrent calculation and fitting of simultaneously recorded GIXRF and XRR data. Based on this approach we developed JGIXA (Java Grazing Incidence X-ray Analysis), a multi-platform software package equipped with a user-friendly graphic user interface (GUI) and offering various optimization algorithms. Software and data evaluation approach were benchmarked by characterizing metal and metal oxide layers on

  8. Determination of heavy metals in macrozoobenthos from the rivers Tisza and Szamos by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Woelfl, S.; Mages, M.; Óvári, M.; Geller, W.

    2006-11-01

    In 2000, accidents in the Romanian mining industry in key catchment areas led to heavy metal contamination of the Hungarian rivers Tisza and Szamos resulting in substantial heavy metal loads in several sediments of the upper river basins. This enhanced metal content might have been bioaccumulated in benthic organisms during the following years. Therefore, the aim of this study was to test, whether the zoobenthic fauna showed an enhanced metal content 3 years after the industrial accident. Macrozoobenthic insect larvae (chironomids) were sampled 100 m below and above the confluent site of the rivers Tisza and Szamos during summer 2003 and for comparison purpose also in the river Maros, a tributary of the Tisza river, during 2005. In order to determine their heavy metal content, single specimens were prepared and analysed by Total Reflection X-ray Fluorescence Spectrometry (TRXF) according to the modified dry method. Fe was much lower and Mn and Zn much higher concentrated in benthos from the more contaminated Szamos river compared to the Tisza and Maros rivers. In this sense, the benthic organisms reflected very well the enhanced metal concentrations in the contaminated rivers being suitable as bioindicators of metal contamination. However, the sediment bioaccumulation factor was low at all sampling sites indicating a low bioavailability of trace metals for benthic organisms.

  9. A novel vacuum spectrometer for total reflection x-ray fluorescence analysis with two exchangeable low power x-ray sources for the analysis of low, medium, and high Z elements in sequence

    NASA Astrophysics Data System (ADS)

    Wobrauschek, P.; Prost, J.; Ingerle, D.; Kregsamer, P.; Misra, N. L.; Streli, C.

    2015-08-01

    The extension of the detectable elemental range with Total Reflection X-ray Fluorescence (TXRF) analysis is a challenging task. In this paper, it is demonstrated how a TXRF spectrometer is modified to analyze elements from carbon to uranium. Based on the existing design of a vacuum TXRF spectrometer with a 12 specimen sample changer, the following components were renewed: the silicon drift detector with 20 mm2 active area and having a special ultra-thin polymer window allowing the detection of elements from carbon upwards. Two exchangeable X-ray sources guarantee the efficient excitation of both low and high Z elements. These X-ray sources were two light-weighted easily mountable 35 W air-cooled low-power tubes with Cr and Rh anodes, respectively. The air cooled tubes and the Peltier-cooled detector allowed to construct a transportable tabletop spectrometer with compact dimensions, as neither liquid nitrogen cooling for the detector nor a water cooling circuit and a bulky high voltage generator for the X-ray tubes are required. Due to the excellent background conditions as a result of the TXRF geometry, detection limits of 150 ng for C, 12 ng for F, and 3.3 ng for Na have been obtained using Cr excitation in vacuum. For Rh excitation, the detection limits of 90 pg could be achieved for Sr. Taking 10 to 20 μl of sample volume, extrapolated detection limits in the ng/g (ppb) range are resulting in terms of concentration.

  10. A novel vacuum spectrometer for total reflection x-ray fluorescence analysis with two exchangeable low power x-ray sources for the analysis of low, medium, and high Z elements in sequence

    SciTech Connect

    Wobrauschek, P. Prost, J.; Ingerle, D.; Kregsamer, P.; Streli, C.; Misra, N. L.

    2015-08-15

    The extension of the detectable elemental range with Total Reflection X-ray Fluorescence (TXRF) analysis is a challenging task. In this paper, it is demonstrated how a TXRF spectrometer is modified to analyze elements from carbon to uranium. Based on the existing design of a vacuum TXRF spectrometer with a 12 specimen sample changer, the following components were renewed: the silicon drift detector with 20 mm{sup 2} active area and having a special ultra-thin polymer window allowing the detection of elements from carbon upwards. Two exchangeable X-ray sources guarantee the efficient excitation of both low and high Z elements. These X-ray sources were two light-weighted easily mountable 35 W air-cooled low-power tubes with Cr and Rh anodes, respectively. The air cooled tubes and the Peltier-cooled detector allowed to construct a transportable tabletop spectrometer with compact dimensions, as neither liquid nitrogen cooling for the detector nor a water cooling circuit and a bulky high voltage generator for the X-ray tubes are required. Due to the excellent background conditions as a result of the TXRF geometry, detection limits of 150 ng for C, 12 ng for F, and 3.3 ng for Na have been obtained using Cr excitation in vacuum. For Rh excitation, the detection limits of 90 pg could be achieved for Sr. Taking 10 to 20 μl of sample volume, extrapolated detection limits in the ng/g (ppb) range are resulting in terms of concentration.

  11. Normalizing a relativistic model of X-ray reflection. Definition of the reflection fraction and its implementation in relxill

    NASA Astrophysics Data System (ADS)

    Dauser, T.; García, J.; Walton, , D. J.; Eikmann, W.; Kallman, T.; McClintock, J.; Wilms, J.

    2016-05-01

    Aims: The only relativistic reflection model that implements a parameter relating the intensity incident on an accretion disk to the observed intensity is relxill. The parameter used in earlier versions of this model, referred to as the reflection strength, is unsatisfactory; it has been superseded by a parameter that provides insight into the accretion geometry, namely the reflection fraction. The reflection fraction is defined as the ratio of the coronal intensity illuminating the disk to the coronal intensity that reaches the observer. Methods: The relxill model combines a general relativistic ray-tracing code and a photoionization code to compute the component of radiation reflected from an accretion that is illuminated by an external source. The reflection fraction is a particularly important parameter for relativistic models with well-defined geometry, such as the lamp post model, which is a focus of this paper. Results: Relativistic spectra are compared for three inclinations and for four values of the key parameter of the lamp post model, namely the height above the black hole of the illuminating, on-axis point source. In all cases, the strongest reflection is produced for low source heights and high spin. A low-spin black hole is shown to be incapable of producing enhanced relativistic reflection. Results for the relxill model are compared to those obtained with other models and a Monte Carlo simulation. Conclusions: Fitting data by using the relxill model and the recently implemented reflection fraction, the geometry of a system can be constrained. The reflection fraction is independent of system parameters such as inclination and black hole spin. The reflection-fraction parameter was implemented with the name refl_frac in all flavours of the relxill model, and the non-relativistic reflection model xillver, in v0.4a (18 January 2016).

  12. Chest x-ray

    MedlinePlus

    ... Images Aortic rupture, chest x-ray Lung cancer, frontal chest x-ray Adenocarcinoma - chest x-ray Coal ... cancer - chest x-ray Lung nodule, right middle lobe - chest x-ray Lung mass, right upper lung - ...

  13. Cation sorption on the muscovite (0 0 1) surface in chloride solutions using high-resolution X-ray reflectivity

    NASA Astrophysics Data System (ADS)

    Schlegel, Michel L.; Nagy, Kathryn. L.; Fenter, Paul; Cheng, Likwan; Sturchio, Neil C.; Jacobsen, Steven D.

    2006-07-01

    The structure and mechanism of cation sorption at the (0 0 1) muscovite-water interface were investigated in 0.01 and 0.5 m KCl, CsCl, and CaCl 2 and 0.01 m BaCl 2 solutions at slightly acidic pH by high-resolution X-ray reflectivity. Structural relaxations of atom positions in the 2 M1 muscovite were small (⩽0.07 Å) and occurred over a distance of 30 to 40 Å perpendicular to the interface. Cations in all solutions were sorbed dominantly in the first and second solution layers adjacent to the mineral surface. The derived heights of the first solution layer in KCl and CsCl solutions, 1.67(6)-1.77(7) and 2.15(9)-2.16(2) Å, respectively, differ in magnitude by the approximate difference in crystallographic radii between K and Cs, and correspond closely to the interlayer cation positions in bulk K- and Cs-mica structures. The first solution layer heights in CaCl 2 and BaCl 2 solutions, 2.46(5)-2.56(11) and 2.02(5) Å, respectively, differ in a sense opposite to that expected based on crystallographic or hydrated radii of the divalent cations. The derived ion heights in all solutions imply that there is no intercalated water layer between the first solution layer and the muscovite surface. Molecular compositions were assigned to the first two solution layers in the electron density profiles using models that constrain the number density of sorbed cations, water molecules, and anions by considering the permanent negative charge of the muscovite and average solution density. The models result in partial charge balance (at least 50%) by cations sorbed in the first two layers in the 0.01 m solutions and approximately full charge balance in the 0.5 m solutions. Damped oscillations of model water density away from the first two solution layers agree with previous X-ray reflectivity results on the muscovite (0 0 1) surface in pure water.

  14. Determination of platinum group metal catalyst residues in active pharmaceutical ingredients by means of total reflection X-ray spectrometry

    NASA Astrophysics Data System (ADS)

    Marguí, Eva; Queralt, Ignasi; Hidalgo, Manuela

    2013-08-01

    The control of metal catalyst residues (i.e., platinum group metals (PGMs)) in different stages of the manufacturing processes of the active pharmaceutical ingredients (APIs) and, especially, in the final product is crucial. For API specimens, there are strict guidelines to limit the levels of metal residues based on their individual levels of safety concern. For PGMs the concentration limit has been established at 10 mg/kg in the API. Therefore great effort is currently being devoted to the development of new and simple procedures to control metals in pharmaceuticals. In the present work, an analytical methodology based on benchtop total reflection X-ray fluorescence spectrometry (TXRF) has been developed for the rapid and simple determination of some PGM catalyst impurities (Rh, Pd, Ir and Pt) in different types of API samples. An evaluation of different sample treatments (dissolution and digestion of the solid pharmaceutical samples) has been carried out and the developed methodologies have been validated according to the analytical parameters to be considered and acceptance criteria for PGM determination according to the United States Pharmacopeia (USP). Limits of quantification obtained for PGM metals were in the range of 2-4 mg/kg which are satisfactory according to current legislation. From the obtained results it is shown that the developed TXRF method can be implemented in the pharmaceutical industries to increase productivity of the laboratory; offering an interesting and complementary analytical tool to other atomic spectroscopic methods.

  15. Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence

    NASA Astrophysics Data System (ADS)

    Vereecke, G.; Arnauts, S.; Van Doorne, P.; Kenis, K.; Onsia, B.; Verstraeten, K.; Schaekers, M.; Van Hoeymissen, J. A. B.; Heyns, M. M.

    2001-11-01

    The validity of a matrix withdrawal method for the analysis of trace metals in silicon nitride films on silicon wafers by total-reflection X-ray fluorescence has been evaluated with samples contaminated with diluted standard solutions of eight metals (Ca, V, Cr, Fe, Ni, Cu, Ta, W). The nitride matrix was removed by a decomposition step with HF vapor at ambient conditions followed by the vaporization of the product at a temperature higher than 240°C. The recovery of added metals was determined first directly after vaporization and secondly after preconcentration by the droplet collection (DC) method. The recovery of metals after vaporization at a temperature of 300±50°C was generally close to 100%, except for Cu whose recovery was approximately 40%. The efficiency of the DC step was approximately 50% for most metals but only 10-20% for Cu and Cr. Thus for most metals the total recovery was close to 50%, which is acceptable for analytical purpose. The recovery of Cu and Cr was studied in more detail considering the influence of the thickness of the nitride film, the vaporization temperature, and the composition of the DC solution. The total recovery of Cu increased from approximately 10 to 40% by lowering the temperature of the vaporization step and using a more concentrated DC solution. The recovery of Cr by DC was markedly influenced by the thickness of the nitride film with no great benefit of using a more concentrated DC solution.

  16. Assessment of serum selenium levels in 2-month-old sucking calves using total reflection X-ray fluorescence technique

    NASA Astrophysics Data System (ADS)

    Buoso, M. C.; Ceccato, D.; Moschini, G.; Bernardini, D.; Testoni, S.; Torboli, A.; Valdes, M.

    2001-11-01

    The assessment of selenium status of livestock plays an important role in the production of medicine since low serum Se levels influence disease resistance in ruminants. It has been proved that Se deficiency may cause muscular dystrophy, cardiomyopathy and even death. Serum level has been widely used to evaluate the Se short-term status in animals since there is a good association between serum Se level and the dietary intake of the element over a wide range. The purpose of this work was to determine the Se serum concentration in a population of 78 sucking 2-month-old calves, in order to corroborate a clinical diagnosis of severe deficiency status. The samples were analyzed by total reflection X-ray fluorescence (TXRF) at the ITAL STRUCTURES Research Laboratory. The results obtained from the serum samples presented Se concentrations varying from 10 to 66 ng/ml. The comparison between the obtained values and the expected serum selenium values (60-80 ng/ml), confirmed a mild to severe deficiency status in the investigated population.

  17. Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering

    NASA Astrophysics Data System (ADS)

    Schwenke, H.; Knoth, J.; Günther, R.; Wiener, G.; Bormann, R.

    1997-07-01

    The capability of total reflection X-ray fluorescence spectrometry (TXRF) for depth profiling is examined by means of selected examples including organometallic layers, an implantation profile of arsenic in silicon and a layered nickel/cobalt structure. For structures without density differences that are deeper than 20 nm or so, and also for buried layers and for the examination of sharp interfaces, which require the highest resolution, two different combinations of ion beam sputtering with TXRF have been employed. A microsectioning technique was investigated in which samples were etched to a bevel shape and subsequently scanned by TXRF. A depth resolution of 2.5 nm was obtained. Alternatively, the so called "transfer technique" was investigated. This involves surface atoms being sputtered by an ion beam and immediately deposited on a silicon wafer rotated behind a slit which is moved in step with the sputter progress. Subsequently, the wafer is scanned by TXRF. Using this technique, the width of a coherent Ti/Al interface within a layered structure was measured to be 1.4 nm. The depth resolutions of the "microsectioning" and the "transfer" techniques are compared with data from RBS, XPS, SIMS and SNMS.

  18. Bacterial S-layer protein coupling to lipids: x-ray reflectivity and grazing incidence diffraction studies.

    PubMed

    Weygand, M; Wetzer, B; Pum, D; Sleytr, U B; Cuvillier, N; Kjaer, K; Howes, P B; Lösche, M

    1999-01-01

    The coupling of bacterial surface (S)-layer proteins to lipid membranes is studied in molecular detail for proteins from Bacillus sphaericus CCM2177 and B. coagulans E38-66 recrystallized at dipalmitoylphosphatidylethanolamine (DPPE) monolayers on aqueous buffer. A comparison of the monolayer structure before and after protein recrystallization shows minimal reorganization of the lipid chains. By contrast, the lipid headgroups show major rearrangements. For the B. sphaericus CCM2177 protein underneath DPPE monolayers, x-ray reflectivity data suggest that amino acid side chains intercalate the lipid headgroups at least to the phosphate moieties, and probably further beyond. The number of electrons in the headgroup region increases by more than four per lipid. Analysis of the changes of the deduced electron density profiles in terms of a molecular interpretation shows that the phosphatidylethanolamine headgroups must reorient toward the surface normal to accommodate such changes. In terms of the protein structure (which is as yet unknown in three dimensions), the electron density profile reveals a thickness lz approximately 90 A of the recrystallized S-layer and shows water-filled cavities near its center. The protein volume fraction reaches maxima of >60% in two horizontal sections of the S-layer, close to the lipid monolayer and close to the free subphase. In between it drops to approximately 20%. Four S-layer protein monomers are located within the unit cell of a square lattice with a spacing of approximately 131 A. PMID:9876158

  19. Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis

    SciTech Connect

    Richard, M.-I.; Malachias, A.; Rouviere, J.-L.; Renaud, G.; Yoon, T.-S.; Holmstroem, E.; Nordlund, K.; Xie, Y.-H.; Favre-Nicolin, V.; Holy, V.; Metzger, T.-H.

    2011-08-15

    Plastic relaxation and formation of defects are crucial issues in the epitaxial growth of nanoparticles and thin films. Indeed, defects generate local stress in the crystalline lattice, which affects their surroundings and may lead to undesired effects such as reduced charge-carrier lifetime or nonradiative recombinations. Here, we use a nondestructive method based on x-ray diffuse scattering close to forbidden reflections to identify the defect types with a high sensitivity and quantify their average size and strain field. Combined with transmission electron microscopy, it offers opportunities to track both ensemble average and single defects inside three-dimensional structures. These techniques have been applied to partially embedded and high-Ge-content (x{sub Ge}=0.87{+-}0.06) dots selectively grown in 20-nm-sized pits on Si(001) surfaces through openings in a SiO{sub 2} template. The stress in the 20-nm-wide Ge islands is relaxed not only by interfacial dislocations but also by microtwins and/or stacking faults located at the interface, proving the importance of {l_brace}111{r_brace} planes and twinning in the relaxation process of nanometer-size Ge dots.

  20. Intelligent Simultaneous Quantitative Online Analysis of Environmental Trace Heavy Metals with Total-Reflection X-Ray Fluorescence

    PubMed Central

    Ma, Junjie; Wang, Yeyao; Yang, Qi; Liu, Yubing; Shi, Ping

    2015-01-01

    Total-reflection X-ray fluorescence (TXRF) has achieved remarkable success with the advantages of simultaneous multi-element analysis capability, decreased background noise, no matrix effects, wide dynamic range, ease of operation, and potential of trace analysis. Simultaneous quantitative online analysis of trace heavy metals is urgently required by dynamic environmental monitoring and management, and TXRF has potential in this application domain. However, it calls for an online analysis scheme based on TXRF as well as a robust and rapid quantification method, which have not been well explored yet. Besides, spectral overlapping and background effects may lead to loss of accuracy or even faulty results during practical quantitative TXRF analysis. This paper proposes an intelligent, multi-element quantification method according to the established online TXRF analysis platform. In the intelligent quantification method, collected characteristic curves of all existing elements and a pre-estimated background curve in the whole spectrum scope are used to approximate the measured spectrum. A novel hybrid algorithm, PSO-RBFN-SA, is designed to solve the curve-fitting problem, with offline global optimization and fast online computing. Experimental results verify that simultaneous quantification of trace heavy metals, including Cr, Mn, Fe, Co, Ni, Cu and Zn, is realized on the online TXRF analysis platform, and both high measurement precision and computational efficiency are obtained. PMID:25954949

  1. Element determination in natural biofilms of mine drainage water by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Mages, Margarete; von Tümpling, Wolf; van der Veen, Andrea; Baborowski, Martina

    2006-11-01

    Human impacts like mining activities lead to higher element concentration in surface waters. For different pollution levels, the consequences for aquatic organisms are not yet investigated in detail. Therefore, the aim of this investigation is to determine the influence of mining affected surface waters on biofilms. Elements like heavy metals can be absorbed on cell walls and on polymeric substances or enter the cytoplasm of the cells. Thus, they are important for the optimization of industrial biotechnological processes and the environmental biotechnology. Beyond this, biofilms can also play an important role in wastewater treatment processes and serve as bioindicators in the aquatic environment. The presented total reflection X-ray fluorescence spectroscopic investigation was performed to compare the element accumulation behavior of biofilms grown on natural or on artificial materials of drainage water affected by former copper mining activities. A high salt and heavy metal pollution is characteristic for the drainage water. For an assessment of these results, samples from stream Schlenze upstream the confluence with the drainage water, a small tributary of the Saale River in central Germany, were analyzed, too.

  2. Is the Calcite-Water Interface Understood? Direct Comparisons of Molecular Dynamics Simulations with Specular X-ray Reflectivity Data

    SciTech Connect

    Fenter, Paul; Kerisit, Sebastien N.; Raiteri, Paolo; Gale, Julian D.

    2013-04-01

    New insights into the structure of the calcite-water interface are obtained through direct model-independent comparison of multiple classical molecular dynamics (MD) simulations with high-resolution specular X-ray reflectivity (XR) data. This set of comparisons, with four different state-of-the-art force fields (including two non-polarizable, one polarizable, and one reactive force field), reveal new insights into the absolute accuracy of the simulated structures and the uniqueness of the XR-derived structural results. These four simulations, while qualitatively similar, have visibly distinct interfacial structure, and are distinguished through a quantitative comparison of the XR signals calculated from these simulations with experimental XR data. The results demonstrate that the simulated calcite-water interface structures, as a whole, are not consistent with the XR data (i.e., within their precision and accuracy). This disagreement is largely due to the simulation of the calcite lattice. The simulated interfacial water profiles show substantially different levels of agreement with the XR data. Of these, the rigid-ion model (RIM) simulations show the best consistency with the experimental XR data. Further model-dependent comparisons of the structural parameters that describe the interfacial structure (derived from both the MD simulations and the XR data) provide further insight into the sources of differences between these two approaches. Using the new insights from the RIM simulations, new structures of the calcite-water interface consistent with both the experimental data and the simulation are identified and compared to recent results.

  3. Determination of trace element distribution in cancerous and normal human tissues by total reflection X-ray fluorescence analysis

    NASA Astrophysics Data System (ADS)

    von Czarnowski, D.; Denkhaus, E.; Lemke, K.

    1997-07-01

    The intention of this study was to establish a method for cancer diagnosis. For this purpose, different trace element distributions in carcinomas of the digestive tract and in normal tissues of human stomach, colon and rectum in correlation to the type of cancer were determined by total reflection X-ray fluorescence analysis (TXRF). The tissue samples were frozen and cut by a microtome into 10 μm sections, and a modified sample excision technique was introduced according to the aim of this research. After drying and spiking of the tissue sections, more than 20 elements, especially biologically relevant ones, were determined. The repeatabilities of measurements of element concentrations in malignant and normal tissues were calculated to be 10-30% (RSD) depending on the specific element. The concentration of Ca was found to be virtually constant (0.250±0.025 μg per 0.1 mm 3) in normal tissue and in carcinoma of the digestive organs. A significant diminution of Cr, Fe and Ni in carcinoma of the stomach, of Cr and Co in carcinoma of the colon and a significant accumulation of K in cancerous tissue of the colon and of Fe and K in neoplastic tissue of the rectum were discovered for a very limited population of patients.

  4. Inorganic pigment study of the San Pedro Gonzalez Telmo Sibyls using total reflection X-ray fluorescence

    NASA Astrophysics Data System (ADS)

    Vázquez, Cristina; Custo, Graciela; Barrio, Néstor; Burucúa, José; Boeykens, Susana; Marte, Fernando

    2010-09-01

    This article describes the study carried out on a series of oil paintings on canvas from the eighteenth century that were restored at Centro de Producción e Investigación en Restauración y Conservación Artística y Bibliográfica - Tarea (CEIRCAB-Tarea), Buenos Aires, Argentina: the San Pedro González Telmo Sibyls. Experimental study was undertaken to identify inorganic pigments and the technique used in their confection; and, in this way, try to add information about their local origin. Therefore special emphasis was put to infer technologies used in the manufacturing of these paintings. Elemental analysis was performed by total reflection X-ray fluorescence spectrometry (TXRF) and complemented by optical and polarized light microscopy. Microsampling was carefully done over areas of the paintings which were damaged and where a small additional loss will not be noticed. This investigation has shown that a variety of pigments were used, namely earth pigments (red and yellow ochres), white lead, vermilion, etc., and they were used either pure or in mixtures. This characterization helped conservators in their decisions regarding a better understanding of the deterioration processes. In addition, this research about the material composition allowed the art historians and restorers the possibility to obtain information about where, when or by whom The San Pedro González Telmo Sibyls may have been painted.

  5. Intelligent simultaneous quantitative online analysis of environmental trace heavy metals with total-reflection X-ray fluorescence.

    PubMed

    Ma, Junjie; Wang, Yeyao; Yang, Qi; Liu, Yubing; Shi, Ping

    2015-01-01

    Total-reflection X-ray fluorescence (TXRF) has achieved remarkable success with the advantages of simultaneous multi-element analysis capability, decreased background noise, no matrix effects, wide dynamic range, ease of operation, and potential of trace analysis. Simultaneous quantitative online analysis of trace heavy metals is urgently required by dynamic environmental monitoring and management, and TXRF has potential in this application domain. However, it calls for an online analysis scheme based on TXRF as well as a robust and rapid quantification method, which have not been well explored yet. Besides, spectral overlapping and background effects may lead to loss of accuracy or even faulty results during practical quantitative TXRF analysis. This paper proposes an intelligent, multi-element quantification method according to the established online TXRF analysis platform. In the intelligent quantification method, collected characteristic curves of all existing elements and a pre-estimated background curve in the whole spectrum scope are used to approximate the measured spectrum. A novel hybrid algorithm, PSO-RBFN-SA, is designed to solve the curve-fitting problem, with offline global optimization and fast online computing. Experimental results verify that simultaneous quantification of trace heavy metals, including Cr, Mn, Fe, Co, Ni, Cu and Zn, is realized on the online TXRF analysis platform, and both high measurement precision and computational efficiency are obtained. PMID:25954949

  6. On the Determination of the Spin of the Black Hole in Cyg X-1 from X-Ray Reflection Spectra

    NASA Technical Reports Server (NTRS)

    Fabian, A. C.; Wilkins, D.; Miller, J. M.; Reis, R. C.; Reynolds, C. S.; Cackett, E. M.; Nowak, M. A.; Pooley, G.; Pottschmidt, K.; Sanders, J. S.; Ross, R. R.; Wilms, J.

    2012-01-01

    The spin of Cygnus X-I is measured by fitting reflection models to Suzaku data covering the energy band 0.9-400 keY. The inner radius of the accretion disc is found to lie within 2 gravitational radii (rg = GM/c(exp 2)) and a value for the dimensionless black hole spin is obtained of 0.97(sup .0.14) (sup -0.02). This agrees with recent measurements using the continuum fitting method by Gou et al. and of the broad iron line by Duro et al. The disc inclination is measured at 23.7(sup +6.7) (sup -5.4) deg. which is consistent with the recent optical measurement of the binary system inclination by Orosz et al of 27+/- 0.8 deg. We pay special attention to the emissivity profile caused by irradiation of the inner disc by the hard power-law source. 1be X-ray observations and simulations show that the index q of that profile deviates from the commonly used, Newtonian, value of 3 within 3r(sub g), steepening considerably within 2r(sub g). as expected in the strong gravity regime.

  7. Polarized neutron reflectivity and X-ray scattering measurements as tools to study properties of Pt/Co/Pt ultrathin layers irradiated by femtosecond laser pulses

    NASA Astrophysics Data System (ADS)

    Szuszkiewicz, Wojciech; Ott, Frédéric; Kisielewski, Jan; Sveklo, Iosif; Dynowska, Elżbieta; Minikayev, Roman; Kurant, Zbigniew; Kuna, Rafał; Jakubowski, Marcin; Wawro, Andrzej; Sobierajski, Ryszard; Maziewski, Andrzej

    2016-04-01

    We have used polarized neutron reflectivity, X-ray diffraction, X-ray reflectivity and magneto-optical Kerr effect in polar configuration to study the properties of ultrathin Pt/Co/Pt films. Structures consisting of a 5-nm thick Pt buffer, 3-nm thick Co layer and 5-nm thick Pt cover layer were deposited onto (0001)-oriented Al2O3 substrate by the molecular beam epitaxy (MBE) method. Irreversible modifications of film properties, resulting from its illumination by single femtosecond laser pulses, of duration of 40 fs and wavelength of 800 nm, were observed and analyzed. As prepared films exhibited magnetization in-plane, but after laser irradiation, the direction of magnetization was rotated to out-of-plane state. Formation of Co-Pt alloy phase caused by quasi-uniform film irradiation was demonstrated by the results of X-ray and neutron scattering measurements. Moreover, polarized neutron and X-ray reflectivity data showed that after illumination Co was distributed mostly in the area of nominal Co layer and Pt cover layer and its diffusion into the Pt buffer was less significant.

  8. Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV

    SciTech Connect

    Imazono, Takashi; Ishino, Masahiko; Koike, Masato; Kimura, Hiroaki; Hirono, Toko; Sano, Kazuo

    2005-02-01

    To develop the polarizer functioning in the soft x-ray region of 1 keV, the polarization performance of muscovite mica has been investigated theoretically with a simulation code based on dynamical theory. As the result of calculation, muscovite mica is found to be a promising candidate as a reflection-type polarizer with the reflectivity for s polarization of 0.03 at approximately 0.9 keV at the angle of incidence of 45 deg. In order to verify the polarization performance of muscovite mica experimentally, a symmetric Bragg reflection measurement of muscovite mica(002) was carried out using a linearly polarized undulator radiation. As a result, the maximum reflectivity for s polarization and the extinction ratio of muscovite mica were approximately 0.018 and 200 at 878 eV, respectively. This result indicates that muscovite mica works as a practical polarizer in the soft x-ray region.

  9. Multi-Spectral Solar Telescope Array. II - Soft X-ray/EUV reflectivity of the multilayer mirrors

    NASA Technical Reports Server (NTRS)

    Barbee, Troy W., Jr.; Weed, J. W.; Hoover, Richard B.; Allen, Maxwell J.; Lindblom, Joakim F.; O'Neal, Ray H.; Kankelborg, Charles C.; Deforest, Craig E.; Paris, Elizabeth S.; Walker, Arthur B. C., Jr.

    1991-01-01

    The Multispectral Solar Telescope Array is a rocket-borne observatory which encompasses seven compact soft X-ray/EUV, multilayer-coated, and two compact far-UV, interference film-coated, Cassegrain and Ritchey-Chretien telescopes. Extensive measurements are presented on the efficiency and spectral bandpass of the X-ray/EUV telescopes. Attention is given to systematic errors and measurement errors.

  10. On symmetric X-ray beam splitting with high efficiency by use of reflection gratings with rectangular profile in the extreme off-plane configuration.

    PubMed

    Jark, Werner; Eichert, Diane

    2015-08-24

    In order to be reflected or diffracted off a surface structure soft X-rays and hard X-rays need to impinge at grazing angles of incidence onto the surface. In case of a reflection grating of highly symmetric structure with rectangular groove profile these grooves can be oriented parallel to the beam trajectory. In such a symmetric situation the distribution of the diffracted intensity with respect to the plane of incidence is then expected to be symmetric. This is indeed observed with symmetrically oriented diffraction peaks. It can be predicted that for appropriate structure parameters the intensity can be contained mostly in two symmetrically oriented diffraction peaks. This will also be the case for hard X-rays. The diffraction efficiency will be particularly high, when the angle of grazing incidence is chosen in the total reflection regime below the critical angle of the grating coating. These predictions were experimentally verified in this work for hard X-rays with photon energies between 4 keV and 12.4 keV. In the experiment of the order of 30% of the incident intensity was diffracted into the two first orders. This is to be compared to reflectivities of the order of 50% measured at the same coating in an unruled area of the substrate. Consequently the relative structural diffraction efficiency for each first order was about 30%, while ideally it could have been 40%. The presented grating structure will thus be a rather efficient amplitude beam splitter for hard X-rays, e.g. in the coherent beam from a free electron laser. In addition such object could then be used as the first component in Michelson interferometers for the beam characterisation or for introducing a time delay between two coherent beams. PMID:26368244

  11. Hard X-Ray Emission of X-Ray Bursters

    NASA Technical Reports Server (NTRS)

    Kaaret, P.

    1999-01-01

    The primary goal of this proposal was to perform an accurate measurement of the broadband x-ray spectrum of a neutron-star low-mass x-ray binary found in a hard x-ray state. This goal was accomplished using data obtained under another proposal, which has provided exciting new information on the hard x-ray emission of neutron-star low-mass x-ray binaries. In "BeppoSAX Observations of the Atoll X-Ray Binary 4U0614+091", we present our analysis of the spectrum of 4U0614+091 over the energy band from 0.3-150 keV. Our data confirm the presence of a hard x-ray tail that can be modeled as thermal Comptonization of low-energy photons on electrons having a very high temperature, greater than 220 keV, or as a non-thermal powerlaw. Such a very hard x-ray spectrum has not been previously seen from neutron-star low-mass x-ray binaries. We also detected a spectral feature that can be interpreted as reprocessing, via Compton reflection, of the direct emission by an optically-thick disk and found a correlation between the photon index of the power-law tail and the fraction of radiation reflected which is similar to the correlation found for black hole candidate x-ray binaries and Seyfert galaxies. A secondary goal was to measure the timing properties of the x-ray emission from neutronstar low-mass x-ray binaries in their low/hard states.

  12. Determination of trace elements in freshwater rotifers and ciliates by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Woelfl, S.; Óvári, M.; Nimptsch, J.; Neu, T. R.; Mages, M.

    2016-02-01

    Element determination in plankton is important for the assessment of metal contamination of aquatic environments. Until recently, it has been difficult to determine elemental content in rotifers or ciliates derived from natural plankton samples because of the difficulty in handling and separation of these fragile organisms. The aim of this study was to evaluate methods for separation of rotifers and large ciliates from natural plankton samples (μg range dry weight) and subsequent analysis of their elemental content using total-reflection X-ray fluorescence spectrometry (TXRF). Plankton samples were collected from different aquatic environments (three lakes, one river) in Chile, Argentina and Hungary. From one to eighty specimens of five rotifer species (Brachionus calyciflorus, Brachionus falcatus, Asplanchna sieboldii, Asplanchna sp., Philodina sp.) and four to twelve specimens of one large ciliate (Stentor amethystinus) were prepared according to the dry method originally developed for microcrustaceans, and analysed by TRXF following in situ microdigestion. Our results demonstrated that it possible to process these small and fragile organisms (individual dry mass: 0.17-9.39 μg ind- 1) via careful washing and preparation procedures. We found species-dependent differences of the element mass fractions for some of the elements studied (Cr, Mn, Fe, Ni, Cu, Zn, As, Pb), especially for Cu, Fe and Mn. One large rotifer species (A. sieboldii) also showed a negative correlation between individual dry weight and the element content for Pb, Ni and Cr. We conclude that our application of the in situ microdigestion-TRXF method is suitable even for rotifers and ciliates, greatly expanding the possibilities for use of plankton in biomonitoring of metal contamination in aquatic environments.

  13. Trace metal determinations by total-reflection X-ray fluorescence analysis in the open Atlantic Ocean

    NASA Astrophysics Data System (ADS)

    Schmidt, Diether; Gerwinski, Wolfgang; Radke, Ina

    1993-02-01

    The Intergovernmental Oceanographic Commission (IOC), as a major component of its programme "Global Investigation of Pollution in the Marine Environment" (GIPME), maintains a long-standing project on "Open Ocean Baseline Studies of Trace Contaminants". Initially, the Atlantic Ocean and trace metals were selected. A first cruise with the RVMeteor to the eastern parts of the south and north Atlantic Ocean was successfully organized, in March and April 1990, from Cape Town (South Africa) to Funchal (Madeira, Portugal). Thirteen scientists from laboratories in Europe and North America participated with the first author as coordinator. Four deep-water stations in the Cape Basin, Angola Basin, Cape Verde Abyssal Plain and Seine Abyssal Plain were regularly sampled for at least 36 depths. Additional samples were taken between stations. Samples were distributed to participants and a similar number of additional laboratories. As a central part of our own contribution to the project, we determined the trace heavy metals manganese, nickel, copper, zinc and lead and the lighter selenium by total-reflection X-ray fluorescence analysis. Additional methods applied, interalia, were anodic stripping voltammetry for lead and cadmium and graphite furnace atomic absorption spectrometry (GFAAS) for cadmium, using two different extraction procedures. For the TXRF, the pre-enrichment of the trace metals and the separation from the salt matrix were performed by complexation with sodium dibenzyldithiocarbamate and reverse-phase chromatography. Generally, very low levels of trace elements were found in filtered and unaltered water samples from these remote areas of the open Atlantic Ocean. Typical examples of the distributions of trace metal concentrations on depth profiles from the four deep-water stations as well as intercomparisons between the stations are presented.

  14. Total reflection X-ray fluorescence analysis of oral fluids of women affected by osteoporosis and osteopenia

    NASA Astrophysics Data System (ADS)

    Sánchez, Héctor Jorge; Valentinuzzi, María Cecilia; Grenón, Miram; Abraham, José

    2008-12-01

    Osteoporosis is a disease characterized by low bone mass and microarchitectural deterioration of bone tissue, leading to bone fragility and an increased susceptibility to fractures; the early stage of decreased bone density is called osteopenia. More than 200 million people are affected and about 50% of post-menopausic women are expected to develop the disease. Osteoporosis, osteopenia and periodontal disease have in common several risk factors, being hyperthyroidism and smoking habits the most important ones. There is scarce information in the literature about the association between periodontal disease and osteoporosis and/or osteopenia. Some works suggest that osteoporotic women are susceptible to a higher loss of periodontal insertion, alveolar bones, and teeth. Thirty adult post-menopausic women were studied; some of them were healthy (control group) and the rest of them were undergoing some stage of osteoporosis or osteopenia. All the subjects were healthy, non-smokers, not having dental implants, and with communitarian periodontal index higher than 1(CPI > 1). Samples of saliva and gingival crevice fluid were extracted with calibrated micro-capillaries and deposited on Si reflectors. Known amounts of Ga were added to the samples in order to act as internal standard for quantification by the total reflection x-ray fluorescence technique. Experimental concentrations of several elements (P, S, Cl, K, Ca, Cr, Fe, NI, Cu, and Zn) were determined. The concentration of some elements in saliva showed different behavior as compared to gingival crevice fluid. Some critical elements of bone composition, such as Ca and Zn, present very distinguishable behavior. Improvements in the statistics are required for a better assessment of a routine method and to establish some correlation with periodontal disease. TXRF seems to be a promising method to evaluate the evolution of osteoporosis.

  15. Application of CO2 Snow Jet Cleaning in Conjunction with Laboratory Based Total Reflection X-Ray Fluorescence

    NASA Technical Reports Server (NTRS)

    Schmeling, M.; Burnett, D. S.; Allton, J. H.; Rodriquez, M.; Tripa, C. E.; Veryovkin, I. V.

    2013-01-01

    The Genesis mission was the first mission returning solar material to Earth since the Apollo program [1,2]. Unfortunately the return of the space craft on September 8, 2004 resulted in a crash landing, which shattered the samples into small fragments and exposed them to desert soil and other debris. Thus only small fragments of the original collectors are available, each having different degrees of surface contamination. Thorough surface cleaning is required to allow for subsequent analysis of solar wind material embedded within. An initial cleaning procedure was developed in coordination with Johnson Space Center which focused on removing larger sized particulates and a thin film organic contamination acquired during collection in space [3]. However, many of the samples have additional residues and more rigorous and/or innovative cleaning steps might be necessary. These cleaning steps must affect only the surface to avoid leaching and re-distribution of solar wind material from the bulk of the collectors. To aid in development and identification of the most appropriate cleaning procedures each sample has to be thoroughly inspected before and after each cleaning step. Laboratory based total reflection X-ray fluorescence (TXRF) spectrometry lends itself to this task as it is a non-destructive and surface sensitive analytical method permitting analysis of elements from aluminum onward present at and near the surface of a flat substrate [4]. The suitability of TXRF has been demonstrated for several Genesis solar wind samples before and after various cleaning methods including acid treatment, gas cluster ion beam, and CO2 snow jet [5 - 7]. The latter one is non-invasive and did show some promise on one sample [5]. To investigate the feasibility of CO2 snow jet cleaning further, several flown Genesis samples were selected to be characterized before and after CO2 snow application with sample 61052 being discussed below.

  16. Zinc and cadmium accumulation in single zebrafish ( Danio rerio) embryos — A total reflection X-ray fluorescence spectrometry application

    NASA Astrophysics Data System (ADS)

    Mages, Margarete; Bandow, Nicole; Küster, Eberhard; Brack, Werner; von Tümpling, Wolf

    2008-12-01

    Trace metals such as Cadmium (Cd) and Zinc (Zn) are known to exhibit adverse effects on many aquatic organisms including early life stages of fish. In contact with contaminated sediment, fish eggs and embryos may be exposed to metals via the water phase as well as via direct contact with contaminated particles. This may result in body burdens that are difficult to predict and may vary according to individual micro scale exposure conditions. The highly sensitive total reflection X-ray fluorescence spectrometry (TXRF) may provide a tool to analyse individual embryos for internal contaminant concentrations and thus helps to develop a better understanding of dose-response relationships. To test this hypothesis, embryos of Danio rerio were exposed to Cd and Zn spiked sediment in different treatments applying an ion exchange resin for modification of bioavailable concentrations. The TXRF analysis indicated individual embryos with dramatically enhanced exposure compared to other individuals despite uniform exposure conditions on a macro scale. Ion exchanger reduced embryo Zn concentrations to values close to control value with a comparably low standard deviation. Cadmium concentrations in embryos were in the range of 4000 to 7000 µg/g with a median of 5740 µg/g. A commercial ion exchanger reduced individual body burdens by a factor 50 to 100. Individual peak body burdens of up to 3160 µg/g were accompanied by reduced weight of the fish eggs due to early death i.e. coagulation. The investigation of exposure and effects on an individual-based scale may significantly help to reduce uncertainty and inconsistencies occurring in conventional analysis of pooled fish embryo samples.

  17. Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Woelfl, Stefan; Mages, Margarete; Encina, Francisco

    2003-12-01

    The recently developed dry method for the element determination of single freshwater microcrustacean specimens ( Daphnia) using total reflection X-ray fluorescence (TXRF) spectrometry showed that inhomogeneities of the biological material on the glass carriers resulted in some cases in high background and hampered the detection of certain trace elements (e.g. Cr, Ni). The aim of this study was to test how inhomogeneities of the biological material can be reduced using cold plasma ashing (CPA) techniques. For that, single specimens of the microcrustacean Daphnia pulex prepared according to the dry method were measured by TXRF before and after CPA. To determine the efficiency of the removal of organic matrix, the background and signal-to-background relationship of 28 samples were analyzed. The results showed (1) a highly significant reduction of the background by CPA fluctuating between 26 and 46% (all elements) and (2) a significant increase of the signal-to-background relationship by the factor 1.5-2.5 (all elements) and a much better detection of Cr, Pb, As and Se. The element concentrations (with exception of Cr, Ni and Pb) after ashing were in the same range or slightly higher than that before ashing. No significant differences between the two treatments were observed for Mn, As, Pb, Se (November), Sr (November), Cr (March) and Pb (March). The element concentration of P, K, Ca, Cu, Zn, Cr (November), Fe and Rb were significantly higher after ashing. In general, they increased by 1.5-13.6% and were highest for Rb (March) and P (November). In contrast, the element concentration of Ni and Cr (only March) decreased significantly after ashing (Ni: 91.6-92.1%, Cr: 91.3%). We recommend the use of CPA for biological material in the microgram-range as a routine method for TXRF analysis, especially when trace elements in minute concentrations are of interest.

  18. Physical interactions of fish protamine and antisepsis peptide drugs with bacterial membranes revealed by combination of specular x-ray reflectivity and grazing-incidence x-ray fluorescence.

    PubMed

    Abuillan, Wasim; Schneck, Emanuel; Körner, Alexander; Brandenburg, Klaus; Gutsmann, Thomas; Gill, Tom; Vorobiev, Alexei; Konovalov, Oleg; Tanaka, Motomu

    2013-07-01

    As a defined model of outer membranes of gram negative bacteria, we investigated the interaction of monolayers of lipopolysacchrides from Salmonella enterica rough strains R90 (LPS Ra) with natural and synthetic peptides. The fine structures perpendicular to the membrane plane and the ion distribution near the interface were determined by specular x-ray reflectivity (XRR) and grazing-incidence x-ray fluorescence (GIXF) in the presence and absence of divalent cations. The unique combination of XRR and GIXF allows for the quantitative identification of different modes of interactions in a high spatial resolution, which cannot be assessed by other experimental methods. Natural fish protamine disrupts the stratified membrane structures in the absence of Ca(2+) ions, while staying away from the membrane surface in the presence of Ca(2+) ions. In contrast, synthetic antisepsis peptide Pep 19-2.5 weakly adsorbs to the membrane and stays near the uncharged sugar units even in the absence of Ca(2+). In the presence of Ca(2+), Pep 19-2.5 can reach the negatively charged inner core without destroying the barrier capability against ions. PMID:23944490

  19. Relativistic reflection in the average X-ray spectrum of active galactic nuclei in the Véron-Cetty and Véron catalogue

    NASA Astrophysics Data System (ADS)

    Falocco, S.; Carrera, F. J.; Barcons, X.; Miniutti, G.; Corral, A.

    2014-08-01

    Context. The X-ray spectra of active galactic nuclei (AGN) unveil properties of matter around the super-massive black hole (SMBH). Aims: We investigate the X-ray spectra of AGN focusing on Compton reflection and fluorescence. These are two of the most important processes of interaction between primary radiation and circumnuclear material that is located far away from the SMBH, as indicated by the unresolved spectral emission lines (most notably the Fe line) in the X-ray spectra of AGN. Contributions from the inner accretion disk, affected by relativistic effects as expected, have also been detected in several cases. Methods: We studied the average X-ray spectrum of a sample of 263 X-ray unabsorbed AGN that yield 419 023 counts in the 2-12 keV rest-frame band distributed among 388 XMM-Newton spectra. Results: We fitted the average spectrum using a (basically) unabsorbed power law (representing the primary radiation). From a second model that represents the interaction (through Compton reflection and fluorescence) of this primary radiation with matter located far away from the central engine (e.g. the putative torus), we found that it was very significantly detected. Finally, we added a contribution from interaction with neutral material in the accretion disk close to the central SMBH, which is therefore smeared by relativistic effects, which improved the fit at a 6 sigma. The reflection factors are 0.65 for the accretion disk and 0.25 for the torus. Replacing the neutral disk-reflection with low-ionisation disk reflection, also relativistically smeared, fits the data equally well, suggesting that we do not find evidence for significant ionisation of the accretion disk. Conclusions: We detect distant neutral reflection associated with a narrow Fe line in the average spectrum of unabsorbed AGN with ⟨ z ⟩ = 0.8. Adding the disk-reflection component associated with a relativistic Fe line improves the data description at a 6 sigma confidence level, suggesting that

  20. Ultra-short-period W/B{sub 4}C multilayers for x-ray optics-microstructure limits on reflectivity

    SciTech Connect

    Walton, C C

    1997-12-01

    Multilayer thin films are used as Bragg reflectors for soft x-rays in the energy range 50eV < E < 1000eV in many x-ray optics applications such as x-ray microscopes and telescopes, reducing optics for extreme ultraviolet (EUV) lithography, and x-ray polarizers and phase retarders. Applications often depend critically on reflectivity, which has not been systematically characterized for multilayer periods below 20{angstrom}. For this study, W/B{sub 4}C multilayers were fabricated by magnetron sputtering on Si(111), with periods from 48{angstrom} to as little as 4.7{angstrom}. The x-ray reflectivity measured at {lambda} = 1.54{angstrom} and at 45{degrees} incidence (289 eV < E < 860 eV) was found to decrease sharply for multilayer periods less than 15-20{angstrom}. Examination by high-resolution transmission electron microscopy (HRTEM) showed an expansion of the thickness of the W-rich layers of 30-40% from the nominal values, consistent with intermixture of the two materials during sputter growth, and discontinuous W-rich layers for multilayer periods below about 15{angstrom}. The experimental data for the specular reflectivity in the hard and soft x-ray regimes and the diffuse scattering fit well to a model of multilayer roughness. The model is expressed as a power-law dependence of roughness on spatial frequency. Analysis of small-angle scattering in transmission from multilayers grown on freestanding Si{sub 3}N{sub 4} membranes confirms the onset of discontinuity at periods between 14{angstrom} and 22{angstrom}. Spectroscopy studies by x-ray absorption (NEXAFS) and electron energy loss (EELS) at the boron K-edge (188eV) are consistent with changes in the average boron bonding environment, as the multilayer period decreases and the W-rich layers are increasingly thin and dispersed. A discrete W-rich phase is present for periods at least as small as 6.3{angstrom}.

  1. Simple method of determination of copper, mercury and lead in potable water with preliminary pre-concentration by total reflection X-ray fluorescence spectrometry

    NASA Astrophysics Data System (ADS)

    Hołyńska, B.; Ostachowicz, B.; Wȩgrzynek, D.

    1996-06-01

    Total reflection X-ray fluorescence spectrometry and chemical pre-concentration procedures have been applied for the analysis of trace concentrations of copper, mercury, and lead in drinking water samples. A simple total reflection module has been used in X-ray measurements. The elements under investigation were pre-concentrated by complexation using a mixture of carbamates followed by solvent extraction with methyl isobutyl ketone. The preconcentration procedure was tested with the use of twice-distilled water samples and samples of mineral and tap water spiked with known additions of copper, mercury, and lead. The obtained recovery and precision values are presented. The minimum detection limits for the determination of these elements in mineral and tap water samples were found to be 40 ng l -1, 60 ng l -1, and 60 ng l -1, respectively.

  2. Direct analysis of blood serum by total reflection X-ray fluorescence spectrometry and application of an artificial neural network approach for cancer diagnosis*1

    NASA Astrophysics Data System (ADS)

    Hernández-Caraballo, Edwin A.; Marcó-Parra, Lué M.

    2003-12-01

    Iron, copper, zinc and selenium were determined directly in serum samples from healthy individuals ( n=33) and cancer patients ( n=27) by total reflection X-ray fluorescence spectrometry using the Compton peak as internal standard [L.M. Marcó P. et al., Spectrochim. Acta Part B 54 (1999) 1469-1480]. The standardized concentrations of these elements were used as input data for two-layer artificial neural networks trained with the generalized delta rule in order to classify such individuals according to their health status. Various artificial neural networks, comprising a linear function in the input layer, a hyperbolic tangent function in the hidden layer and a sigmoid function in the output layer, were evaluated for such a purpose. Of the networks studied, the (4:4:1) gave the highest estimation (98%) and prediction rates (94%). The latter demonstrates the potential of the total reflection X-ray fluorescence spectrometry/artificial neural network approach in clinical chemistry.

  3. The Multi-Spectral Solar Telescope Array. II - Soft X-ray/EUV reflectivity of the multilayer mirrors

    NASA Technical Reports Server (NTRS)

    Barbee, Troy W., Jr.; Weed, J. W.; Hoover, Richard B. C., Jr.; Allen, Max J.; Lindblom, Joakim F.; O'Neal, Ray H.; Kankelborg, Charles C.; Deforest, Craig E.; Paris, Elizabeth S.; Walker, Arthur B. C.

    1992-01-01

    We have developed seven compact soft X-ray/EUV (XUV) multilayer coated and two compact FUV interference film coated Cassegrain and Ritchey-Chretien telescopes for a rocket borne observatory, the Multi-Spectral Solar Telescope Array. We report here on extensive measurements of the efficiency and spectral bandpass of the XUV telescopes carried out at the Stanford Synchrotron Radiation Laboratory.

  4. Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region

    NASA Astrophysics Data System (ADS)

    Sharma, Saurabh; Gupta, R. K.; Sinha, Mangalika; Yadav, P.; Singh, Amol; Modi, Mohammed H.

    2016-05-01

    Reflectivity beamline at Indus-1 synchrotron source is used to determine optical constants of a platinum thin film in the soft x-ray wavelength region of 40-200Å by applying Kramers-Kronig (KK) technique on R vs wavelength data. Upto 150Å wavelength region the results of KK analysis are found in good agreement with the Henke's optical constants and also with those obtained by the angle dependent reflectivity technique. A significant mismatch is observed above 150Å wavelength region which could be due to the presence of higher harmonics in the toroidal grating spectra of the reflectivity beamline.

  5. Exploring the interfacial structure of protein adsorbates and the kinetics of protein adsorption: an in situ high-energy X-ray reflectivity study.

    PubMed

    Evers, Florian; Shokuie, Kaveh; Paulus, Michael; Sternemann, Christian; Czeslik, Claus; Tolan, Metin

    2008-09-16

    The high energy X-ray reflectivity technique has been applied to study the interfacial structure of protein adsorbates and protein adsorption kinetics in situ. For this purpose, the adsorption of lysozyme at the hydrophilic silica-water interface has been chosen as a model system. The structure of adsorbed lysozyme layers was probed for various aqueous solution conditions. The effect of solution pH and lysozyme concentration on the interfacial structure was measured. Monolayer formation was observed for all cases except for the highest concentration. The adsorbed protein layers consist of adsorbed lysozyme molecules with side-on or end-on orientation. By means of time-dependent X-ray reflectivity scans, the time-evolution of adsorbed proteins was monitored as well. The results of this study demonstrate the capabilities of in situ X-ray reflectivity experiments on protein adsorbates. The great advantages of this method are the broad wave vector range available and the high time resolution. PMID:18715021

  6. Comment on Sub-15 nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate

    SciTech Connect

    Specht, Eliot D

    2011-01-01

    Takano et al. report the focusing of 10-keV X-rays to a size of 14.4 nm using a total-reflection zone plate (TRZP). This focal size is at the diffraction limit for the optic's aperture. This would be a noteworthy result, since the TRZP was fabricated using conventional lithography techniques. Alternative nanofocusing optics require more demanding fabrication methods. However, as I will discuss in this Comment, the intensity distribution presented by Takano et al. (Fig. 4 of ref. 1) is more consistent with the random speckle pattern produced by the scattering of a coherent incident beam by a distorted optic than with a diffraction-limited focus. When interpreted in this manner, the true focal spot size is {approx}70 nm: 5 times the diffraction limit. When a coherent photon beam illuminates an optic containing randomly distributed regions which introduce different phase shifts, the scattered diffraction pattern consists of a speckle pattern. Each speckle will be diffraction-limited: the peak width of a single speckle depends entirely on the source coherence and gives no information about the optic. The envelope of the speckle distribution corresponds to the focal spot which would be observed using incoherent illumination. The width of this envelope is due to the finite size of the coherently-diffracting domains produced by slope and position errors in the optic. The focal intensity distribution in Fig. 4 of ref. 1 indeed contains a diffraction-limited peak, but this peak contains only a fraction of the power in the focused, and forms part of a distribution of sharp peaks with an envelope {approx}70 nm in width, just as expected for a speckle pattern. At the 4mm focal distance, the 70 nm width corresponds to a slope error of 18 {micro}rad. To reach the 14 nm diffraction limit, the slope error must be reduced to 3 {micro}rad. Takano et al. have identified a likely source of this error: warping due to stress as a result of zone deposition. It will be interesting to see

  7. Reflection Grating Array Associated with the Reflection Grating Spectrometer Developed by the Space Research Organization of the Netherlands for the X-ray Multi-Mirror Mission (XMM)

    NASA Technical Reports Server (NTRS)

    Kahn, Steven M.

    2001-01-01

    The University of California, Berkeley (UCB) served as the Principal Investigator institution for the United States participation in the development of the Reflection Grating Spectrometer (RGS) which included the design, development, fabrication, and testing of the Reflection Grating Assembly (RGA). UCB was assisted in this role by the Lawrence Livermore National Laboratory and Columbia University who provided the primary facilities, materials, services and personnel necessary to complete the development. UC Berkeley's Dr. Steven Kahn provided the technical and scientific oversight for the design. development and testing of the RGA units by monitoring the performance of the units at various stages in their development. Dr. Kahn was also the primary contact with the Space Research Organization of the Netherlands (SRON) and represented the RGA development at all SRON and European Space Agency (ESA) reviews of the RGA status. In accordance with the contract, the team designed and developed novel optical technology to meet the unique requirements of the RGS. The ESA XMM-Newton Mission carries two identical Reflection Grating Spectrometers (RGS) behind two of its three nested sets of Wolter I type mirrors. The instrument allows high-resolution measurements in the soft X-ray range (6 to 38 angstroms or 2.1 to 0.3 keV) with a maximum effective area of about 140 sq cm at 15 angstroms. Its design is optimized for the detection of the K-shell transitions of carbon, nitrogen, oxygen, neon, magnesium, and silicon. as well as the L shell transitions of iron. The RGA itself consists of two units. A structure for each unit was designed to hold up to 220 gratings. In its final configuration, one unit holds 182 gratings and the second hold 181 gratings.

  8. Imaging slitless spectrometer for X-ray astronomy

    NASA Technical Reports Server (NTRS)

    Gursky, H.; Zehnpfennig, T.

    1968-01-01

    Imaging slitless spectrometer, a combination of an X ray transmission /or reflection/ grating and image-forming X ray telescope, is capable of obtaining simultaneous spatial and spectral information about celestial X ray sources.

  9. Fluorescence-based knife-edge beam diameter measurement to characterize X-ray beam profiles in reflection geometry

    NASA Astrophysics Data System (ADS)

    Bassel, Léna; Tauzin, Xavier; Queffelec, Alain; Ferrier, Catherine; Lacanette, Delphine; Chapoulie, Rémy; Bousquet, Bruno

    2016-04-01

    The diameter of an X-ray beam was determined, using the knife-edge technique, widely applied for beam profiling, by taking advantage of the fluorescence emission generated by the X-ray beam. The knife-edge has to be appropriate to the configuration of the device, in our case a double-material target made of plastic and cardboard was scanned in a transversal plane compared to the beam propagation direction. Along the scanning axis, for each position, the intensity of the Kα line of chlorine was recorded. The first derivative of the intensity evolution as a function of the edge position, fitted by a Gaussian function, makes it possible to obtain the beam diameter along the scan direction. We measured a slightly elliptic diameter close to 3 mm. In this note we underline the significance of the knife-edge technique which represents a useful tool, easy to be set up, to control X-ray beam dimensions in portable devices often routinely used by non-specialists.

  10. X-ray shearing interferometer

    DOEpatents

    Koch, Jeffrey A.

    2003-07-08

    An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1.times. magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.