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Sample records for 200-nm-thick zno film

  1. A 200 nm thick glass-forming metallic film for fatigue-property enhancements

    NASA Astrophysics Data System (ADS)

    Chiang, C. L.; Chu, J. P.; Liu, F. X.; Liaw, P. K.; Buchanan, R. A.

    2006-03-01

    In this letter, we report the fatigue-property enhancement by a thin layer of glass-forming film. The fatigue life of a 316L stainless steel is considerably improved by at least 30 times, depending on the maximum applied stress when it is coated with a 200nm thick Zr47Cu31Al13Ni9 film. The application of the sputtered film yields an increase of the fatigue limit by 30%. The smooth surface, good adhesion, and compressive residual stress are found to play beneficial roles in achieving superior fatigue properties, revealing the glass-forming film as a potential material to enhance fatigue properties.

  2. Homoepitaxial ZnO Film Growth

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C-H; Lehoczky, S. L.; Harris, M. T.; Callahan, M. J.; McCarty, P.; George, M. A.; Rose, M. Franklin (Technical Monitor)

    2000-01-01

    ZnO films have high potential for many applications, such as surface acoustic wave filters, UV detectors, and light emitting devices due to its structural, electrical, and optical properties. High quality epitaxial films are required for these applications. The Al2O3 substrate is commonly used for ZnO heteroepitaxial growth. Recently, high quality ZnO single crystals are available for grow homoepitaxial films. Epitaxial ZnO films were grown on the two polar surfaces (O-face and Zn-face) of (0001) ZnO single crystal substrates using off-axis magnetron sputtering deposition. As a comparison, films were also deposited on (0001) Al2O3 substrates. It was found that the two polar ZnO surfaces have different photoluminescence (PL) spectrum, surface structure and morphology, which strongly influence the epitaxial film growth. The morphology and structure of homoepitaxial films grown on the ZnO substrates were different from heteroepitaxial films grown on the Al2O3. An interesting result shows that high temperature annealing of ZnO single crystals will improve the surface structure on the O-face surface rather than the opposite surface. The measurements of PL, low-angle incident x-ray diffraction, and atomic force microscopy of ZnO films indicate that the O-terminated surface is better for ZnO epitaxial film growth.

  3. Direct synthesis and characterization of optically transparent conformal zinc oxide nanocrystalline thin films by rapid thermal plasma CVD.

    PubMed

    Pedersen, Joachim D; Esposito, Heather J; Teh, Kwok Siong

    2011-10-31

    We report a rapid, self-catalyzed, solid precursor-based thermal plasma chemical vapor deposition process for depositing a conformal, nonporous, and optically transparent nanocrystalline ZnO thin film at 130 Torr (0.17 atm). Pure solid zinc is inductively heated and melted, followed by ionization by thermal induction argon/oxygen plasma to produce conformal, nonporous nanocrystalline ZnO films at a growth rate of up to 50 nm/min on amorphous and crystalline substrates including Si (100), fused quartz, glass, muscovite, c- and a-plane sapphire (Al2O3), gold, titanium, and polyimide. X-ray diffraction indicates the grains of as-deposited ZnO to be highly textured, with the fastest growth occurring along the c-axis. The individual grains are observed to be faceted by (103) planes which are the slowest growth planes. ZnO nanocrystalline films of nominal thicknesses of 200 nm are deposited at substrate temperatures of 330°C and 160°C on metal/ceramic substrates and polymer substrates, respectively. In addition, 20-nm- and 200-nm-thick films are also deposited on quartz substrates for optical characterization. At optical spectra above 375 nm, the measured optical transmittance of a 200-nm-thick ZnO film is greater than 80%, while that of a 20-nm-thick film is close to 100%. For a 200-nm-thick ZnO film with an average grain size of 100 nm, a four-point probe measurement shows electrical conductivity of up to 910 S/m. Annealing of 200-nm-thick ZnO films in 300 sccm pure argon at temperatures ranging from 750°C to 950°C (at homologous temperatures between 0.46 and 0.54) alters the textures and morphologies of the thin film. Based on scanning electron microscope images, higher annealing temperatures appear to restructure the ZnO nanocrystalline films to form nanorods of ZnO due to a combination of grain boundary diffusion and bulk diffusion.PACS: films and coatings, 81.15.-z; nanocrystalline materials, 81.07.Bc; II-VI semiconductors, 81.05.Dz.

  4. Dye-Sensitization Of Nanocrystalline ZnO Thin Films

    SciTech Connect

    Ajimsha, R. S.; Tyagi, M.; Das, A. K.; Misra, P.; Kukreja, L. M.

    2010-12-01

    Nannocrystalline and nanoporus thin films of ZnO were synthesized on glass substrates by using wet chemical drop casting method. X-ray diffraction measurements on these samples confirmed the formation of ZnO nanocrystallites in hexagonal wurtzite phase with mean size of {approx}20 nm. Photo sensitization of these nanostructured ZnO thin films was carried out using three types of dyes Rhodamine 6 G, Chlorophyll and cocktail of Rhodamine 6 G and Chlorophyll in 1:1 ratio. Dye sensitized ZnO thin films showed enhanced optical absorption in visible spectral region compared to the pristine ZnO thin films.

  5. Synthesis and characterization of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Anilkumar T., S.; Girija M., L.; Venkatesh, J.

    2016-05-01

    Zinc oxide (ZnO) Thin films were deposited on glass substrate using Spin coating method. Zinc acetate dehydrate, Carbinol and Mono-ethanolamine were used as the precursor, solvent and stabilizer respectively to prepare ZnO Thin-films. The molar ratio of Monoethanolamine to Zinc acetate was maintained as approximately 1. The thickness of the films was determined by Interference technique. The optical properties of the films were studied by UV Vis-Spectrophotometer. From transmittance and absorbance curve, the energy band gap of ZnO is found out. Electrical Conductivity measurements of ZnO are carried out by two probe method and Activation energy for the electrical conductivity of ZnO are found out. The crystal structure and orientation of the films were analyzed by XRD. The XRD patterns show that the ZnO films are polycrystalline with wurtzite hexagonal structure.

  6. Substrate Preparations in Epitaxial ZnO Film Growth

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C.-H.; Lehoczky, S. L.; Harris, M. T.; Callahan, M. J.; George, M. A.

    2000-01-01

    Epitaxial ZnO films were grown on the two polar surfaces (O-face and Zn-face) of (0001) ZnO single crystal substrates using off-axis magnetron sputtering deposition. Annealing-temperature dependence of ZnO substrates was studied. ZnO films grown on sapphire substrates have also been investigated for comparison purposes and the annealing temperature of A1203 substrates is 1000 C. Substrates and films were characterized using photoluminescence (PL) spectrum, x-ray diffraction, atomic force microscope, energy dispersive spectrum, and electric transport measurements. It has been found that the ZnO film properties were different when films were grown on the two polarity surfaces of ZnO substrates and the A1203 substrates. An interesting result shows that high temperature annealing of ZnO single crystals will improve the surface structure on the O-face surface rather than the opposite surface. The measurements of homoepitaxial ZnO films indicate that the O-terminated surface is better for ZnO epitaxial film growth.

  7. Strong circular photogalvanic effect in ZnO epitaxial films

    SciTech Connect

    Zhang, Q.; Wang, X. Q.; Yin, C. M.; Shen, B.; Chen, Y. H.; Chang, K.; Ge, W. K.

    2011-12-23

    A strong circular photogalvanic effect (CPGE) in ZnO epitaxial films was reported under interband excitation. It was observed that CPGE current is as large as 100 nA/W in ZnO, which is about one order in magnitude higher than that in InN film while the CPGE currents in GaN films are not detectable. The possible reasons for the above observations are the strong spin orbit coupling in ZnO or the inversed valence band structure of ZnO.

  8. Strong circular photogalvanic effect in ZnO epitaxial films

    NASA Astrophysics Data System (ADS)

    Zhang, Q.; Wang, X. Q.; Yin, C. M.; Shen, B.; Chen, Y. H.; Chang, K.; Ge, W. K.

    2011-12-01

    A strong circular photogalvanic effect (CPGE) in ZnO epitaxial films was reported under interband excitation. It was observed that CPGE current is as large as 100 nA/W in ZnO, which is about one order in magnitude higher than that in InN film while the CPGE currents in GaN films are not detectable. The possible reasons for the above observations are the strong spin orbit coupling in ZnO or the inversed valence band structure of ZnO.

  9. Strong circular photogalvanic effect in ZnO epitaxial films

    NASA Astrophysics Data System (ADS)

    Zhang, Q.; Wang, X. Q.; Yin, C. M.; Xu, F. J.; Tang, N.; Shen, B.; Chen, Y. H.; Chang, K.; Ge, W. K.; Ishitani, Y.; Yoshikawa, A.

    2010-07-01

    We report a strong circular photogalvanic effect (CPGE) in ZnO epitaxial films under interband excitation. It is observed that CPGE current is as large as 100 nA/W in ZnO, which is about one order in magnitude higher than that in InN film while the CPGE currents in GaN films are not detectable. The possible reasons for the above observations are the strong spin orbit coupling in ZnO or the inversed valence band structure of ZnO.

  10. Self-standing particle-binding ZnO film.

    PubMed

    Masuda, Yoshitake; Kato, Kazumi

    2009-01-01

    Self-standing particle-binding ZnO film was fabricated by combination of crystallization in aqueous solution and annealing on FTO (SnO2:F) coated glass substrate. Multi-needle ZnO particles crystallized in a solution of zinc nitrate hexahydrate and ethylenediamine at 60 degrees C. Crystalline particles having an ultrafine surface relief structure were gradually deposited on the substrate to form thick particulate film. The film was then annealed at 950 degrees C for 1 h in air. The ZnO particles formed necks to connect to each other. The glass substrate deformed into a dome shape generating stress between the ZnO film and substrate; on the other hand, FTO layers retained their uneven surface during annealing. ZnO particulate film was successfully peeled off from the substrate as self-standing film. Deformation of glass substrate and FTO joint-insulating layer supported peeling-off of the film. The connected ZnO particles formed continuous white porous film having many spaces and continuous open pores surrounded by multi-needle ZnO particles. The film can be used as self-standing film and be pasted on substrate such as polymer film, metal or paper for application to flexible lightweight devices.

  11. Growth of Homoepitaxial ZnO Semiconducting Films

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, Ching-Hua; Lehoczky, S. L.; Harris, M. T.; George, Michael A.; McCarty, P.

    1999-01-01

    As a high temperature semiconductor, ZnO has been used for many applications such as wave-guide, solar cells, and surface acoustic wave devices. Since the ZnO material has an energy gap of 3.3 eV at room temperature and an excitonic binding energy (60 meV) that is possible to make excitonic lasering at room temperature a recent surge of interest is to synthesize ZnO films for electro-optical devices. These applications require films with a smooth surface, good crystal quality, and low defect density. Homoepitaxial films have been studied in terms of morphology, crystal structure, and electrical and optical properties. ZnO single crystals are grown by the hydrothermal method. Substrates are mechanically polished and annealed in air for four hours before deposited films. The annealing temperature-dependence of ZnO substrates is studied. Films are synthesized by the off-axis reactive sputtering deposition. The films have very smooth surface with a roughness film theta rocking curves measured by the x-ray diffraction is slightly larger than the crystal substrate. The film quality is determined by measuring the film resistivity, the Hall mobility, carrier densities and the energy band gap. The properties of ZnO films grown of (0001) ZnO and (0001) sapphire substrates will be also compared and discussed in the presentation.

  12. Liquid crystal alignment on ZnO nanostructure films

    NASA Astrophysics Data System (ADS)

    Chung, Yueh-Feng; Chen, Mu-Zhe; Yang, Sheng-Hsiung; Jeng, Shie-Chang

    2016-03-01

    The study of liquid crystal (LC) alignment is important for fundamental researches and industrial applications. The tunable pretilt angles of liquid crystal (LC) molecules aligned on the inorganic zinc oxide (ZnO) nanostructure films with controllable surface wettability are demonstrated in this work. The ZnO nanostructure films are deposited on the ITO- glass substrates by the two-steps hydrothermal process, and their wettability can be modified by annealing. Our experimental results show that the pretilt angles of LCs on ZnO nanostructure films can be successfully adjusted over a wide range from ~90° to ~0° as the surface energy on the ZnO nanostructure films changes from ~30 to ~70 mJ/m. Finally we have applied this technique to fabricate a no-bias optically-compensated bend (OCB) LCD with ZnO nanostructure films annealed at 235 °C.

  13. Green emission in carbon doped ZnO films

    SciTech Connect

    Tseng, L. T.; Yi, J. B. Zhang, X. Y.; Xing, G. Z.; Luo, X.; Li, S.; Fan, H. M.; Herng, T. S.; Ding, J.; Ionescu, M.

    2014-06-15

    The emission behavior of C-doped ZnO films, which were prepared by implantation of carbon into ZnO films, is investigated. Orange/red emission is observed for the films with the thickness of 60–100 nm. However, the film with thickness of 200 nm shows strong green emission. Further investigations by annealing bulk ZnO single crystals under different environments, i.e. Ar, Zn or C vapor, indicated that the complex defects based on Zn interstitials are responsible for the strong green emission. The existence of complex defects was confirmed by electron spin resonance (ESR) and low temperature photoluminescence (PL) measurement.

  14. Growth of vertically aligned ZnO nanorods using textured ZnO films

    PubMed Central

    2011-01-01

    A hydrothermal method to grow vertical-aligned ZnO nanorod arrays on ZnO films obtained by atomic layer deposition (ALD) is presented. The growth of ZnO nanorods is studied as function of the crystallographic orientation of the ZnO films deposited on silicon (100) substrates. Different thicknesses of ZnO films around 40 to 180 nm were obtained and characterized before carrying out the growth process by hydrothermal methods. A textured ZnO layer with preferential direction in the normal c-axes is formed on substrates by the decomposition of diethylzinc to provide nucleation sites for vertical nanorod growth. Crystallographic orientation of the ZnO nanorods and ZnO-ALD films was determined by X-ray diffraction analysis. Composition, morphologies, length, size, and diameter of the nanorods were studied using a scanning electron microscope and energy dispersed x-ray spectroscopy analyses. In this work, it is demonstrated that crystallinity of the ZnO-ALD films plays an important role in the vertical-aligned ZnO nanorod growth. The nanorod arrays synthesized in solution had a diameter, length, density, and orientation desirable for a potential application as photosensitive materials in the manufacture of semiconductor-polymer solar cells. PACS 61.46.Hk, Nanocrystals; 61.46.Km, Structure of nanowires and nanorods; 81.07.Gf, Nanowires; 81.15.Gh, Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.) PMID:21899743

  15. Nanostructured ZnO Films for Room Temperature Ammonia Sensing

    NASA Astrophysics Data System (ADS)

    Dhivya Ponnusamy; Sridharan Madanagurusamy

    2014-09-01

    Zinc oxide (ZnO) thin films have been deposited by a reactive dc magnetron sputtering technique onto a thoroughly cleaned glass substrate at room temperature. X-ray diffraction revealed that the deposited film was polycrystalline in nature. The field emission scanning electron micrograph (FE-SEM) showed the uniform formation of a rugby ball-shaped ZnO nanostructure. Energy dispersive x-ray analysis (EDX) confirmed that the film was stoichiometric and the direct band gap of the film, determined using UV-Vis spectroscopy, was 3.29 eV. The ZnO nanostructured film exhibited better sensing towards ammonia (NH3) at room temperature (˜30°C). The fabricated ZnO film based sensor was capable of detecting NH3 at as low as 5 ppm, and its parameters, such as response, selectivity, stability, and response/recovery time, were also investigated.

  16. Li doped ZnO thin films for optoelectronic applications

    NASA Astrophysics Data System (ADS)

    Sandeep, K. M.; Bhat, Shreesha; Serrao, F. J.; Dharmaprakash, S. M.

    2016-05-01

    We have prepared undoped (ZnO) and Li doped ZnO (LZO) thin films using cost effective sol gel spin coating method.The structural properties were analyzed by X-ray diffraction, and it showed that Li ions occupied interstitial positions in the LZO film. The optical properties like band bending effect, absorption length, band edge sharpness, which have direct impact on solar cell performance has been calculated. The room temperature photoluminescence spectra of the films showed dominant blue emission with CIE coordinate numbers (0.1384, 0.0836) for ZnO and (0.1356, 0.0910) for LZO. The dominating wavelength of the blue emission is present at 470.9 nm and 472.3 nm for ZnO and LZO films respectively. The structural and optical parameters determined in the present study could be used in LED applications.

  17. Growth of Homoepitaxial ZnO Semiconducting Films

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C.-H.; Lehoczky, S. L.; Harris, M. T.; George, M. A.; McCarty, P.

    1999-01-01

    As a high temperature wide-band-gap (3.3 eV at room temperature) semiconductor, ZnO has been used for many applications such as wave-guides, solar cells, and surface acoustic wave devices, Since ZnO has a 60 meV excitonic binding energy that makes it possible to produce excitonic lasing at room temperature, a recent surge of interest is to synthesize ZnO films for UV/blue/green laser diodes. These applications require films with a smooth surface, good crystal quality, and low defect density. Thus, homoepitaxial film growth is the best choice. Homoepitaxial films have been studied in terms of morphology, crystal structure, and electrical and optical properties. ZnO single crystal substrates grown by the hydrothermal method are mechanically polished and annealed in air for four hours before the films are deposited. The annealing temperature-dependence on ZnO substrate morphology and electrical properties is investigated. Films are synthesized by off-axis reactive sputtering deposition. This produces films that have very smooth surfaces with roughness less than or equal to 5 nm on a 5 microns x 5 microns area. The full width at half maximum of film theta rocking curves measured by the x-ray diffraction is slightly larger than that of the crystal substrate. Films are also characterized by measuring resistivity, optical transmittance, and photoluminescence. The properties of ZnO films grown on (0001) ZnO and (0001) sapphire substrates will also be compared and discussed.

  18. The sprayed ZnO films: nanostructures and physical parameters

    NASA Astrophysics Data System (ADS)

    Benhaliliba, M.; Tiburcio-Silver, A.; Avila-Garcia, A.; Tavira, A.; Ocak, Y. S.; Aida, M. S.; Benouis, C. E.

    2015-08-01

    We synthesized the pure and indium-doped (IZO) ZnO films with a facile composition control spray pyrolysis route. The substrate temperature (Ts) and In-doping effects on the properties of as-grown films are investigated. The X-ray pattern confirms that the as-synthesized ZnO phase is grown along a (002) preferential plane. It is revealed that the crystalline structure is improved with a substrate temperature of 350 °C. Moreover, the morphology of as-grown films, analyzed by AFM, shows nanostructures that have grown along the c-axis. The (3 × 3 μm2) area scanned AFM surface studies give the smooth film surface RMS < 40 nm. The UV-VIS-IR measurements reveal that the sprayed films are highly transparent in the visible and IR bands. The photoluminescence analysis shows that the strong blue and yellow luminescences of 2.11 and 2.81 eV are emitted from ZnO and IZO films with a slight shift in photon energy caused by In-doping. The band gap is a bit widened by In-doping, 3.21 eV (ZnO) and 3.31 eV (IZO) and the resistivity is reduced from 385 to 8 Ω·m. An interesting result is the resistivity linear dependence on the substrate temperature of pure ZnO films.

  19. Improved Response of ZnO Films for Pyroelectric Devices

    PubMed Central

    Hsiao, Chun-Ching; Yu, Shih-Yuan

    2012-01-01

    Increasing the temperature variation rate is a useful method for enhancing the response of pyroelectric devices. A three-dimensional ZnO film was fabricated by the aerosol deposition (AD) rapid process using the shadow mask method, which induces lateral temperature gradients on the sidewalls of the responsive element, thereby increasing the temperature variation rate. To enhance the quality of the film and reduce the concentration of defects, the film was further treated by laser annealing, and the integration of a comb-like top electrode enhanced the voltage response and reduced the response time of the resulting ZnO pyroelectric devices. PMID:23235444

  20. Transparent photostable ZnO nonvolatile memory transistor with ferroelectric polymer and sputter-deposited oxide gate

    NASA Astrophysics Data System (ADS)

    Park, C. H.; Im, Seongil; Yun, Jungheum; Lee, Gun Hwan; Lee, Byoung H.; Sung, Myung M.

    2009-11-01

    We report on the fabrication of transparent top-gate ZnO nonvolatile memory thin-film transistors (NVM-TFTs) with 200 nm thick poly(vinylidene fluoride/trifluoroethylene) ferroelectric layer; semitransparent 10 nm thin AgOx and transparent 130 nm thick indium-zinc oxide (IZO) were deposited on the ferroelectric polymer as gate electrode by rf sputtering. Our semitransparent NVM-TFT with AgOx gate operates under low voltage write-erase (WR-ER) pulse of ±20 V, but shows some degradation in retention property. In contrast, our transparent IZO-gated device displays very good retention properties but requires anomalously higher pulse of ±70 V for WR and ER states. Both devices stably operated under visible illuminations.

  1. Transparent photostable ZnO nonvolatile memory transistor with ferroelectric polymer and sputter-deposited oxide gate

    SciTech Connect

    Park, C. H.; Im, Seongil; Yun, Jungheum; Lee, Gun Hwan; Lee, Byoung H.; Sung, Myung M.

    2009-11-30

    We report on the fabrication of transparent top-gate ZnO nonvolatile memory thin-film transistors (NVM-TFTs) with 200 nm thick poly(vinylidene fluoride/trifluoroethylene) ferroelectric layer; semitransparent 10 nm thin AgO{sub x} and transparent 130 nm thick indium-zinc oxide (IZO) were deposited on the ferroelectric polymer as gate electrode by rf sputtering. Our semitransparent NVM-TFT with AgO{sub x} gate operates under low voltage write-erase (WR-ER) pulse of {+-}20 V, but shows some degradation in retention property. In contrast, our transparent IZO-gated device displays very good retention properties but requires anomalously higher pulse of {+-}70 V for WR and ER states. Both devices stably operated under visible illuminations.

  2. ZnO Thin Film Electronics for More than Displays

    NASA Astrophysics Data System (ADS)

    Ramirez, Jose Israel

    Zinc oxide thin film transistors (TFTs) are investigated in this work for large-area electronic applications outside of display technology. A constant pressure, constant flow, showerhead, plasma-enhanced atomic layer deposition (PEALD) process has been developed to fabricate high mobility TFTs and circuits on rigid and flexible substrates at 200 °C. ZnO films and resulting devices prepared by PEALD and pulsed laser deposition (PLD) have been compared. Both PEALD and PLD ZnO films result in densely packed, polycrystalline ZnO thin films that were used to make high performance devices. PEALD ZnO TFTs deposited at 300 °C have a field-effect mobility of ˜ 40 cm2/V-s (and > 20 cm2/V-S deposited at 200 °C). PLD ZnO TFTs, annealed at 400 °C, have a field-effect mobility of > 60 cm2/V-s (and up to 100 cm2/V-s). Devices, prepared by either technique, show high gamma-ray radiation tolerance of up to 100 Mrad(SiO2) with only a small radiation-induced threshold voltage shift (VT ˜ -1.5 V). Electrical biasing during irradiation showed no enhanced radiation-induced effects. The study of the radiation effects as a function of material stack thicknesses revealed the majority of the radiation-induced charge collection happens at the semiconductor-passivation interface. A simple sheet-charge model at that interface can describe the radiation-induced charge in ZnO TFTs. By taking advantage of the substrate-agnostic process provided by PEALD, due to its low-temperature and excellent conformal coatings, ZnO electronics were monolithically integrated with thin-film complex oxides. Application-based examples where ZnO electronics provide added functionality to complex oxide-based devices are presented. In particular, the integration of arrayed lead zirconate titanate (Pb(Zr, Ti)O3 or PZT) thin films with ZnO electronics for microelectromechanical systems (MEMs) and deformable mirrors is demonstrated. ZnO switches can provide voltage to PZT capacitors with fast charging and slow

  3. A high power ZnO thin film piezoelectric generator

    NASA Astrophysics Data System (ADS)

    Qin, Weiwei; Li, Tao; Li, Yutong; Qiu, Junwen; Ma, Xianjun; Chen, Xiaoqiang; Hu, Xuefeng; Zhang, Wei

    2016-02-01

    A highly efficient and large area piezoelectric ZnO thin film nanogenerator (NG) was fabricated. The ZnO thin film was deposited onto a Si substrate by pulsed laser ablation at a substrate temperature of 500 °C. The deposited ZnO film exhibited a preferred c-axis orientation and a high piezoelectric value of 49.7 pm/V characterized using Piezoelectric Force Microscopy (PFM). Thin films of ZnO were patterned into rectangular power sources with dimensions of 0.5 × 0.5 cm2 with metallic top and bottom electrodes constructed via conventional semiconductor lithographic patterning processes. The NG units were subjected to periodic bending/unbending motions produced by mechanical impingement at a fixed frequency of 100 Hz at a pressure of 0.4 kg/cm2. The output electrical voltage, current density, and power density generated by one ZnO NG were recorded. Values of ∼95 mV, 35 μA cm-2 and 5.1 mW cm-2 were recorded. The level of power density is typical to that produced by a PZT NG on a flexible substrate. Higher energy NG sources can be easily created by adding more power units either in parallel or in series. The thin film ZnO NG technique is highly adaptable with current semiconductor processes, and as such, is easily integrated with signal collecting circuits that are compatible with mass production. A typical application would be using the power harvested from irregular human foot motions to either to operate blue LEDs directly or to drive a sensor network node in mille-power level without any external electric source and circuits.

  4. Structural and electrical properties of electric field assisted spray deposited pea structured ZnO film

    NASA Astrophysics Data System (ADS)

    Chaturvedi, Neha; Swami, Sanjay Kumar; Dutta, Viresh

    2016-05-01

    Spray deposition of ZnO film was carried out. The uneven growth of ZnO nanostructures is resulted for spray deposited ZnO film. Application of DC voltage (1000V) during spray deposition provides formation of pea like structures with uniform coverage over the substrate. Electric field assisted spray deposition provides increased crystallinity with reduced resistivity and improved mobility of the ZnO film as compared to spray deposited ZnO film without electric field. This with large area deposition makes the process more efficient than other techniques.

  5. Semiconducting properties of Al doped ZnO thin films.

    PubMed

    Al-Ghamdi, Ahmed A; Al-Hartomy, Omar A; El Okr, M; Nawar, A M; El-Gazzar, S; El-Tantawy, Farid; Yakuphanoglu, F

    2014-10-15

    Aluminum doped ZnO (AZO) thin films were successfully deposited via spin coating technique onto glass substrates. Structural properties of the films were analyzed by X-ray diffraction, atomic force microscopy (AFM) and energy dispersive X-ray spectroscopy. X-ray diffraction results reveal that all the films are polycrystalline with a hexagonal wurtzite structure with a preferential orientation according to the direction (002) plane. The crystallite size of ZnO and AZO films was determined from Scherrer's formula and Williamson-Hall analysis. The lattice parameters of the AZO films were found to decrease with increasing Al content. Energy dispersive spectroscopy (EDX) results indicate that Zn, Al and O elements are present in the AZO thin films. The electrical conductivity, mobility carriers and carrier concentration of the films are increased with increasing Al doping concentration. The optical band gap (Eg) of the films is increased with increasing Al concentration. The AZO thin films indicate a high transparency in the visible region with an average value of 86%. These transparent AZO films may be open a new avenue for optoelectronic and photonic devices applications in near future.

  6. Role of ZnO thin film in the vertically aligned growth of ZnO nanorods by chemical bath deposition

    NASA Astrophysics Data System (ADS)

    Son, Nguyen Thanh; Noh, Jin-Seo; Park, Sungho

    2016-08-01

    The effect of ZnO thin film on the growth of ZnO nanorods was investigated. ZnO thin films were sputter-deposited on Si substrate with varying the thickness. ZnO nanorods were grown on the thin film using a chemical bath deposition (CBD) method at 90 °C. The ZnO thin films showed granular structure and vertical roughness on the surface, which facilitated the vertical growth of ZnO nanorods. The average grain size and the surface roughness of ZnO film increased with an increase in film thickness, and this led to the increase in both the average diameter and the average length of vertically grown ZnO nanorods. In particular, it was found that the average diameter of ZnO nanorods was very close to the average grain size of ZnO thin film, confirming the role of ZnO film as a seed layer for the vertical growth of ZnO nanorods. The CBD growth on ZnO seed layers may provide a facile route to engineering vertically aligned ZnO nanorod arrays.

  7. Development of nanostructured ZnO thin film via electrohydrodynamic atomization technique and its photoconductivity characteristics.

    PubMed

    Duraisamy, Navaneethan; Kwon, Ki Rin; Jo, Jeongdai; Choi, Kyung-Hyun

    2014-08-01

    This article presents the non-vacuum technique for the preparation of nanostructured zinc oxide (ZnO) thin film on glass substrate through electrohydrodynamic atomization (EHDA) technique. The detailed process parameters for achieving homogeneous ZnO thin films are clearly discussed. The crystallinity and surface morphology of ZnO thin film are investigated by X-ray diffraction and field emission scanning electron microscopy. The result shows that the deposited ZnO thin film is oriented in the wurtzite phase with void free surface morphology. The surface roughness of deposited ZnO thin film is found to be ~17.8 nm. The optical properties of nanostructured ZnO thin films show the average transmittance is about 90% in the visible region and the energy band gap is found to be 3.17 eV. The surface chemistry and purity of deposited ZnO thin films are analyzed by fourier transform infrared and X-ray photoelectron spectroscopy, conforming the presence of Zn-O in the deposited thin films without any organic moiety. The photocurrent measurement of nanostructured ZnO thin film is examined in the presence of UV light illumination with wavelength of 365 nm. These results suggest that the deposited nanostructured ZnO thin film through EHDA technique possess promising applications in the near future.

  8. Electrodeposited ZnO films with high UV emission properties

    SciTech Connect

    Matei, Elena; Enculescu, Ionut

    2011-11-15

    Highlights: {yields} Electrodeposition of ZnO from nitrate baths is investigated. {yields} The influence of process parameters on morphological and optical properties is studied. {yields} Experimental conditions to fabricate ZnO films with high UV emission were found. -- Abstract: We report here our results in the preparation of ZnO films with high UV band to band characteristic luminescence emission by potentiostatic electrodeposition. Zinc nitrate aqueous baths with different concentration and additives were employed for the preparation of the films on platinum substrates. We focused our research in determining how the electrodeposition bath composition, i.e. zinc nitrate concentration and addition of KCl or polyvinyl pyrolidone and applied overpotential influence the morphological and optical properties of the oxide films. Scanning electron microscopy was employed for characterizing the films in terms of morphology. Optical reflection, photoluminescence spectroscopy and cathodoluminescence were used for determining the optical characteristics of the samples. The morphology of the deposit varies from hexagonal prisms to platelets as a function of the deposition rate. This experimental parameter also influences the luminescence properties. We found that at low deposition rates high UV luminescent material is obtained.

  9. Highly stable precursor solution containing ZnO nanoparticles for the preparation of ZnO thin film transistors.

    PubMed

    Huang, Heh-Chang; Hsieh, Tsung-Eong

    2010-07-23

    ZnO particles with an average size of about 5 nm were prepared via a sol-gel chemical route and the silane coupling agent, (3-glycidyloxypropyl)-trimethoxysilane (GPTS), was adopted to enhance the dispersion of the ZnO nanoparticles in ethyl glycol (EG) solution. A ZnO surface potential as high as 66 mV was observed and a sedimentation test showed that the ZnO precursor solution remains transparent for six months of storage, elucidating the success of surface modification on ZnO nanoparticles. The ZnO thin films were then prepared by spin coating the precursor solution on a Si wafer and annealing treatments at temperatures up to 500 degrees C were performed for subsequent preparation of ZnO thin film transistors (TFTs). Microstructure characterization revealed that the coalescence of ZnO nanoparticles occurs at temperatures as low as 200 degrees C to result in a highly uniform, nearly pore-free layer. However, annealing at higher temperatures was required to remove organic residues in the ZnO layer for satisfactory device performance. The 500 degrees C-annealed ZnO TFT sample exhibited the best electrical properties with on/off ratio = 10(5), threshold voltage = 17.1 V and mobility (micro) = 0.104 cm(2) V(-1) s(-1).

  10. Oxygen vacancy-induced ferromagnetism in un-doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Zhan, Peng; Wang, Weipeng; Liu, Can; Hu, Yang; Li, Zhengcao; Zhang, Zhengjun; Zhang, Peng; Wang, Baoyi; Cao, Xingzhong

    2012-02-01

    ZnO films became ferromagnetic when defects were introduced by thermal-annealing in flowing argon. This ferromagnetism, as shown by the photoluminescence measurement and positron annihilation analysis, was induced by the singly occupied oxygen vacancy with a saturated magnetization dependent positively on the amount of this vacancy. This study clarified the origin of the ferromagnetism of un-doped ZnO thin films and provides possibly an alternative way to prepare ferromagnetic ZnO films.

  11. Mn doped nanostucture ZnO thin film for photo sensor and gas sensor application

    NASA Astrophysics Data System (ADS)

    Mahajan, Sandip V.; Upadhye, Deepak S.; Shaikh, Shahid U.; Birajadar, Ravikiran B.; Siddiqui, Farha Y.; Ghule, Anil V.; Sharma, Ramphal

    2013-02-01

    Mn doped nanostructure ZnO thin film prepared by soft chemically route method. ZnO thin films were deposited on glass substrate by successive ionic layer adsorption and reaction technique (SILAR). After deposit ZnO thin film dipped in MnSO4 solution for 1 min. The optical properties as absorbance were determined using UV-Spectrophotometer and band gap was also calculated. The Structural properties were studied by XRD. The improvement in gas sensing properties was found to enhance after doping of Mn on ZnO thin film. The Photo Sensor nature was calculated by I-V characteristics.

  12. Nanostructured ZnO films on stainless steel are highly safe and effective for antimicrobial applications.

    PubMed

    Shim, Kyudae; Abdellatif, Mohamed; Choi, Eunsoo; Kim, Dongkyun

    2017-04-01

    The safety and effectiveness of antimicrobial ZnO films must be established for general applications. In this study, the antimicrobial activity, skin irritation, elution behavior, and mechanical properties of nanostructured ZnO films on stainless steel were evaluated. ZnO nanoparticle (NP) and ZnO nanowall (NW) structures were prepared with different surface roughnesses, wettability, and concentrations using an RF magnetron sputtering system. The thicknesses of ZnO NP and ZnO NW were approximately 300 and 620 nm, respectively, and ZnO NW had two diffraction directions of [0002] and [01-10] based on high-resolution transmission electron microscopy. The ZnO NW structure demonstrated 99.9% antimicrobial inhibition against Escherichia coli, Staphylococcus aureus, and Penicillium funiculosum, and no skin irritation was detected using experimental rabbits. Approximately 27.2 ± 3.0 μg L(-1) Zn ions were eluted from the ZnO NW film at 100 °C for 24 h, which satisfies the WHO guidelines for drinking water quality. Furthermore, the Vickers hardness and fracture toughness of ZnO NW films on stainless steel were enhanced by 11 and 14% compared to those of the parent stainless steel. Based on these results, ZnO NW films on STS316L sheets are useful for household supplies, such as water pipes, faucets, and stainless steel containers.

  13. Thin film epitaxy and structure property correlations for non-polar ZnO films

    SciTech Connect

    Pant, Punam; Budai, John D; Aggarwal, R; Narayan, Roger; Narayan, Jagdish

    2009-01-01

    Heteroepitaxial growth and strain relaxation were investigated in non-polar a-plane (11-20)ZnO films grown on r-plane (10-12)sapphire substrates in the temperature range 200-700 C by pulsed laser deposition. The lattice misfit in the plane of the film for this orientation varied from -1.26% in [0001] to ?18.52% in the [-1100] direction. The alignment of (11-20)ZnO planes parallel to (10-12)sapphire planes was confirmed by X-ray diffraction {theta}-2{theta} scans over the entire temperature range. X-ray {psi}-scans revealed the epitaxial relationship:[0001]ZnO[-1101]sap; [-1100]ZnO[-1-120]sap. Depending on the growth temperature, variations in the structural, optical and electrical properties were observed in the grown films. Room temperature photoluminescence for films grown at 700 C shows a strong band-edge emission. The ratio of the band-edge emission to green band emission is 135:1, indicating reduced defects and excellent optical quality of the films. The resistivity data for the films grown at 700 C shows semiconducting behavior with room temperature resistivity of 2.2 x 10{sup -3} {Omega}-cm.

  14. Persistent photoconductivity in highly porous ZnO films

    NASA Astrophysics Data System (ADS)

    Reemts, Jens; Kittel, Achim

    2007-01-01

    ZnO and ZnO-dye hybrid films prepared by electrochemical deposition are highly porous if fabricated in the presence of structure directing agents and they can easily be sensitized by various molecules. If the material is sensitized with the appropriate molecules, it becomes interesting for various sensor applications, i.e., gas sensors and biosensors, or as an electrode material for solar energy conversion in dye sensitized solar cells. In the present work, the focus is on dye sensitized ZnO as a model system. The long term photoconductivity transients have been investigated in such kind of material. Upon excitation with different wavelengths, the conductivity increases already under sub-band-gap illumination due to widely distributed trap states within the band gap. The slow photoconductivity transients follow a stretched exponential law if the illumination is rapidly changing in a dry atmosphere. The underlying mechanism of persistent photoconductivity can be attributed to a lattice relaxation process of surface states, immediately after electrons have been photoexcited into distributed surface states located inside the band gap of the ZnO thin film.

  15. Structural, optical and electronic structure studies of Al doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Devi, Vanita; Kumar, Manish; Shukla, D. K.; Choudhary, R. J.; Phase, D. M.; Kumar, Ravindra; Joshi, B. C.

    2015-07-01

    Structural, optical and electronic structure of Al doped ZnO thin films grown using pulsed laser deposition on glass substrate are investigated. X-ray diffraction measurements reveal that all the films are textured along the c-axis and have wurtzite structure. Al doping in ZnO films leads to increase in grain size due to relaxation in compressive stress. Enhancement in band gap of ZnO films with the Al doping is also noticed which can be ascribed to the Brustein-Moss shift. The changes in the electronic structure caused by Al in the doped thin film samples are understood through X-ray absorption measurements.

  16. Physical and electronic properties of electrodeposited ZnO thin films: dependence on thickness

    NASA Astrophysics Data System (ADS)

    Kıcır, N.; Ozkendir, O. M.; Farha, A. H.; Kırmızıgül, F.; Tuken, T.; Gumus, C.; Çabuk, S.; Erbil, M.; Ufuktepe, Y.

    2015-10-01

    ZnO films have been prepared on indium tin oxide-coated glass substrates, with the help of a potentiostatic method in aqueous zinc nitrate solution. Dependence of crystallographic, optical and electronic properties on thickness of the film is reported and discussed. An increase in the film thickness causes an increase in the band and leads to an improvement in crystallinity and conductivity. The experimental results suggest a strong correlation between electronic and crystal structure of the polycrystalline wurtzite ZnO films. These observations can be used to establish guidelines for optimizing the thickness and orientation to increase the control of device performance based on ZnO thin films.

  17. Automated electrochemical synthesis and photoelectrochemical characterization of Zn1-xCo(x)O thin films for solar hydrogen production.

    PubMed

    Jaramillo, Thomas F; Baeck, Sung-Hyeon; Kleiman-Shwarsctein, Alan; Choi, Kyoung-Shin; Stucky, Galen D; McFarland, Eric W

    2005-01-01

    High-throughput electrochemical methods have been developed for the investigation of Zn1-xCo(x)O films for photoelectrochemical hydrogen production from water. A library of 120 samples containing 27 different compositions (0 films, with Zn0.956Co0.044O exhibiting a 4-fold improvement over pure ZnO with no external bias. Flat-band potential, bias-dependent photocurrent, and action spectra were also measured automatically with the high-throughput screening system. The 200-nm-thick films were subsequently characterized by numerous techniques, including SEM, XRD, XPS, and UV-vis, which show that the depositions are well-controlled. Zn/Co stoichiometry in the films was controlled by the ratio of the Zn and Co precursors in each deposition bath. All films exhibited the wurtzite structure typical of pure ZnO, and the Co2+ appears to substitute Zn2+, forming a single-phase solid solution. Band gaps of the solid solutions were systematically lower than the 3.2-eV band gap typical of ZnO.

  18. Nitrogen oxides and ammonia sensing characteristics of SILAR deposited ZnO thin film

    NASA Astrophysics Data System (ADS)

    Lupan, O. I.; Shishiyanu, S. T.; Shishiyanu, T. S.

    2007-07-01

    Pure and Sn, Ni doped ZnO thin films were deposited on glass substrates using a novel successive ionic layer adsorption and reaction (SILAR) method at room temperature. Microstructures of the deposited films were optimized by adjusting growth parameters. The variation in resistivity of the ZnO film sensors was performed with rapid photothermal processing (RPP). The effect of rapid photothermal processing was found to have an important role in ZnO based sensor sensitivity to NO 2, NH 3. While the undoped ZnO film surface exhibited higher NH 3 sensitivity than that of NO 2, an enhanced NO 2 sensitivity was noticed for the ZnO films doped with Sn and higher NH 3 sensitivity was obtained by Ni doping.

  19. Surface Morphological and Nanomechanical Properties of PLD-Derived ZnO Thin Films

    PubMed Central

    2008-01-01

    This study reports the surface roughness and nanomechanical characteristics of ZnO thin films deposited on the various substrates, obtained by means of atomic force microscopy (AFM), nanoindentation and nanoscratch techniques. ZnO thin films are deposited on (a- and c-axis) sapphires and (0001) 6H-SiC substrates by using the pulsed-laser depositions (PLD) system. Continuous stiffness measurements (CSM) technique is used in the nanoindentation tests to determine the hardness and Young’s modulus of ZnO thin films. The importance of the ratio (H/Efilm) of elastic to plastic deformation during nanoindentation of ZnO thin films on their behaviors in contact-induced damage during fabrication of ZnO-based devices is considered. In addition, the friction coefficient of ZnO thin films is also presented here.

  20. Morphological, Mechanical and Thermal Study of ZnO Nanoparticle Reinforced Chitosan Based Transparent Biocomposite Films

    NASA Astrophysics Data System (ADS)

    Das, Kunal; Maiti, Sonakshi; Liu, Dagang

    2014-04-01

    Chitosan based biocomposite transparent films reinforced with zinc oxide (ZnO) nanoparticles at different loading i.e. 2, 4 and 6 wt% were successfully prepared by solution casting method. Shape, size and geometry of the zinc oxide nanoparticles were characterized by scanning electron microscopy (SEM). The biocomposite films were subjected to mechanical characterization, thermal analysis, morphology study and moisture uptake behaviour. The characterization tools used here include wide angle X-ray diffraction study, scanning electron microscopic analysis, differential scanning calorimetric analysis and also UV-visible transmittance behavior. SEM micrographs revealed uniformly dispersed ZnO nanoparticles in biocomposite films. Improvement of the tensile strength about 133 % was observed significantly in case of 4 wt% loaded chitosan/ZnO films with respect to the neat chitosan film. 43 % higher transparency was observed in case of 2 wt% ZnO loaded biocomposites films, thus indicating the best combination of properties of 2 wt% ZnO loaded biocomposite films.

  1. Synthesis and characterization of ZnO nanostructured film for optoelectronic applications

    SciTech Connect

    Kumar, Vijay E-mail: sanjeev04101977@gmail.com; Singh, Harpreetpal

    2015-05-15

    ZnO nanostructured film is synthesized by solution combustion technique. X-ray diffraction (XRD) studies show that preferred orientation is along (101) confirming the hexagonal wurtzite phase and no secondary phase is observed. The rietveld refinement of the XRD data was used to calculate different lattice parameters. I-V characterization of ZnO film shows non linear behavior. These ZnO films are photosensitive, may be due to defect states. This property of these films can be utilized in optoelectronic applications.

  2. Macroparticles Reduction Using Filter Free Cathodic Vacuum Arc Deposition Method in ZnO Thin Films.

    PubMed

    Yuvakkumar, R; Peranantham, P; Nathanael, A Joseph; Nataraj, D; Mangalaraj, D; Hong, Sun Ig

    2015-03-01

    We report a new method to reduce macroparticles in ZnO thin films using filter free cathodic vacuum arc deposition without using any cooling arrangements operated at low arc current. The detailed mechanism has been proposed to reduce macroparticles during thin film deposition. The successful reduction of macroparticles was confirmed employing FESEM-EDX studies. FESEM images of ZnO thin films deposited with cathode spot to substrate distance from 10 to 20 cm revealed that the population of the macroparticles were reduced with the increase of cathode spot to substrate distances at low arc current. The prepared ZnO films were characterised and showed good structural and optical properties.

  3. Crystallographic polarity effect of ZnO on thin film growth of pentacene

    NASA Astrophysics Data System (ADS)

    Nakamura, Tatsuru; Nagata, Takahiro; Hayakawa, Ryoma; Yoshimura, Takeshi; Oh, Seungjun; Hiroshiba, Nobuya; Chikyow, Toyohiro; Fujimura, Norifumi; Wakayama, Yutaka

    2017-04-01

    The spontaneous polarization effect of ZnO on the thin film growth of pentacene, which is a typical π conjunction organic semiconductor, was investigated. Pentacene thin films were grown on polar ZnO surfaces by ultraslow organic film physical vapor deposition to obtain layer-by-layer growth. X-ray diffraction measurements revealed that pentacene molecules stand upright on polar ZnO surfaces, and that the films consist of two polymorphs, namely, the thin-film and bulk phases. The thin-film phases of pentacene were observed regardless of the polarity of the ZnO substrate at a thickness of less than six molecular layers. However, pentacene on a Zn-polar ZnO substrate gradually changed to the bulk phase unlike that on an O-polar ZnO substrate. Kelvin probe force microscopy measurements revealed that the surface potential of pentacene becomes more positive with increasing pentacene thickness at less than two molecular layers. The variation in the potential of pentacene on the Zn-polar ZnO substrate was larger than that of pentacene on the O-polar ZnO substrate. These findings indicate that the polarity of the semiconductor can control the growth and electronic state of the inorganic/organic semiconductor interface.

  4. Substrate effect on the room-temperature ferromagnetism in un-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Zhan, Peng; Wang, Weipeng; Xie, Zheng; Li, Zhengcao; Zhang, Zhengjun; Zhang, Peng; Wang, Baoyi; Cao, Xingzhong

    2012-07-01

    Room-temperature ferromagnetism was achieved in un-doped ZnO films on silicon and quartz substrates. Photoluminescence measurement and positron annihilation analysis suggested that the ferromagnetism was originated from singly occupied oxygen vacancies (roughly estimated as ˜0.55 μB/vacancy), created in ZnO films by annealing in argon. The saturated magnetization of ZnO films was enhanced from ˜0.44 emu/g (on quartz) to ˜1.18 emu/g (on silicon) after annealing at 600 °C, as silicon acted as oxygen getter and created more oxygen vacancies in ZnO films. This study clarified the origin of ferromagnetism in un-doped ZnO and provides an idea to enhance the ferromagnetism.

  5. Fabrication of nanostructured Al-doped ZnO thin film for methane sensing applications

    NASA Astrophysics Data System (ADS)

    Shafura, A. K.; Sin, N. D. Md.; Azhar, N. E. I.; Saurdi, I.; Uzer, M.; Mamat, M. H.; Shuhaimi, A.; Alrokayan, Salman A. H.; Khan, Haseeb A.; Rusop, M.

    2016-07-01

    CH4 gas sensor was fabricated using spin-coating method of the nanostructured ZnO thin film. Effect of annealing temperature on the electrical and structural properties of the film was investigated. Dense nanostructured ZnO film are obtained at higher annealing temperature. The optimal condition of annealing temperature is 500°C which has conductivity and sensitivity value of 3.3 × 10-3 S/cm and 11.5%, respectively.

  6. Enhanced Gas Sensing Properties of Spin-coated Na-doped ZnO Nanostructured Films

    PubMed Central

    Basyooni, Mohamed A.; Shaban, Mohamed; El Sayed, Adel M.

    2017-01-01

    In this report, the structures, morphologies, optical, electrical and gas sensing properties of ZnO and ZnO: Na spin-coated films are studied. X-ray diffraction (XRD) results reveal that the films are of a single phase wurtzite ZnO with a preferential orientation along (002) direction parallel to c-axis. Na doping reduces the crystalline quality of the films. The plane surface of ZnO film turned to be wrinkle net-work structure after doping. The reflectance and the optical band gap of the ZnO film decreased after Na doping. The wrinkle net-work nanostructured Na-doped film shows an unusually sensitivity, 81.9% @ 50 sccm, for CO2 gas at room temperature compared to 1.0% for the pure ZnO film. The signals to noise ratio (SNR) and detection limit of Na-doped ZnO sensor are 0.24 and 0.42 sccm, respectively. These enhanced sensing properties are ascribed to high surface-to-volume ratio, hoping effect, and the increase of O- vacancies density according to Kroger VinK effect. The response time increased from 179 to 240 s by the incorporation of Na atoms @50 sccm. This response time increased as the CO2 concentration increased. The recovery time is increased from 122 to 472 s by the incorporation of Na atoms @50 sccm. PMID:28145506

  7. Enhanced Gas Sensing Properties of Spin-coated Na-doped ZnO Nanostructured Films.

    PubMed

    Basyooni, Mohamed A; Shaban, Mohamed; El Sayed, Adel M

    2017-02-01

    In this report, the structures, morphologies, optical, electrical and gas sensing properties of ZnO and ZnO: Na spin-coated films are studied. X-ray diffraction (XRD) results reveal that the films are of a single phase wurtzite ZnO with a preferential orientation along (002) direction parallel to c-axis. Na doping reduces the crystalline quality of the films. The plane surface of ZnO film turned to be wrinkle net-work structure after doping. The reflectance and the optical band gap of the ZnO film decreased after Na doping. The wrinkle net-work nanostructured Na-doped film shows an unusually sensitivity, 81.9% @ 50 sccm, for CO2 gas at room temperature compared to 1.0% for the pure ZnO film. The signals to noise ratio (SNR) and detection limit of Na-doped ZnO sensor are 0.24 and 0.42 sccm, respectively. These enhanced sensing properties are ascribed to high surface-to-volume ratio, hoping effect, and the increase of O- vacancies density according to Kroger VinK effect. The response time increased from 179 to 240 s by the incorporation of Na atoms @50 sccm. This response time increased as the CO2 concentration increased. The recovery time is increased from 122 to 472 s by the incorporation of Na atoms @50 sccm.

  8. Enhanced Gas Sensing Properties of Spin-coated Na-doped ZnO Nanostructured Films

    NASA Astrophysics Data System (ADS)

    Basyooni, Mohamed A.; Shaban, Mohamed; El Sayed, Adel M.

    2017-02-01

    In this report, the structures, morphologies, optical, electrical and gas sensing properties of ZnO and ZnO: Na spin-coated films are studied. X-ray diffraction (XRD) results reveal that the films are of a single phase wurtzite ZnO with a preferential orientation along (002) direction parallel to c-axis. Na doping reduces the crystalline quality of the films. The plane surface of ZnO film turned to be wrinkle net-work structure after doping. The reflectance and the optical band gap of the ZnO film decreased after Na doping. The wrinkle net-work nanostructured Na-doped film shows an unusually sensitivity, 81.9% @ 50 sccm, for CO2 gas at room temperature compared to 1.0% for the pure ZnO film. The signals to noise ratio (SNR) and detection limit of Na-doped ZnO sensor are 0.24 and 0.42 sccm, respectively. These enhanced sensing properties are ascribed to high surface-to-volume ratio, hoping effect, and the increase of O- vacancies density according to Kroger VinK effect. The response time increased from 179 to 240 s by the incorporation of Na atoms @50 sccm. This response time increased as the CO2 concentration increased. The recovery time is increased from 122 to 472 s by the incorporation of Na atoms @50 sccm.

  9. Anomalous capacitance change in low-temperature grown ZnO thin-film transistors

    NASA Astrophysics Data System (ADS)

    Seo, O.; Kim, H.; Jo, J.

    2010-10-01

    We studied capacitance-voltage characteristics of ZnO thin-film transistors (TFT's), grown by metalorganic chemical vapor deposition (MOCVD). We compared two ZnO TFT's: one grown at 450 °C and the other at 350 °C. ZnO grown at 450 °C showed smooth capacitance profile with electron density of 1.5×1020 cm-3. In contrast, ZnO grown at 350 °C showed a capacitance jump when gate voltage was changed to negative voltages. Current-voltage characteristics measured in the two samples did not show much difference. We explain that the capacitance jump is related to p-type ZnO layer formed at the SiO2 interface. Current-voltage and capacitance-voltage data support that our ZnO films have anisotropic conductivity.

  10. Defect assisted saturable absorption characteristics in Al and Li doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    K. M., Sandeep; Bhat, Shreesha; S. M., Dharmaprakash; P. S., Patil; Byrappa, K.

    2016-09-01

    The influence of different doping ratios of Al and Li on the nonlinear optical properties, namely, a two-photon absorption and a nonlinear refraction using single beam Z-scan technique, of nano-crystalline ZnO thin films has been investigated in the present study. A sol-gel spin-coated pure ZnO, Al-doped ZnO (AZO), and Li-doped ZnO (LZO) thin films have been prepared. The stoichiometric deviations induced by the occupancy of Al3+ and Li+ ions at the interstitial sites injects the compressive stress in the AZO and LZO thin films, respectively, while the extended defect states below the conduction band leads to a redshift of energy band gap in the corresponding films as compared to pure ZnO thin film. Switching from an induced absorption in ZnO and 1 at. wt. % doped AZO and LZO films to a saturable absorption (SA) in 2 at. wt. % doped AZO and LZO films has been observed, and it is attributed to the saturation of a linear absorption of the defect states. The closed aperture Z-scan technique revealed the self-focusing (a positive nonlinear refractive index) in all the films, which emerge out of the thermo-optical effects due to the continuous illumination of laser pulses. A higher third-order nonlinear optical susceptibility χ(3) of the order 10-3 esu has been observed in all the films.

  11. Synthesis of nano-dimensional ZnO and Ga doped ZnO thin films by vapor phase transport and study as transparent conducting oxide.

    PubMed

    Ghosh, S; Saurav, M; Pandey, B; Srivastava, P

    2008-05-01

    We report synthesis of polycrystalline ZnO and Ga doped ZnO (ZnO:Ga) thin films (approximately 80 nm) on Si and quartz substrates in a non-vacuum muffle furnace, a simple and cost-effective route, without any catalyst/reactive carrier gases, at relatively low processing temperature of 550 degrees C. The crystalline phases of the films are identified by grazing angle X-ray diffraction (GAXRD). The growth of ZnO films is examined with scanning electron microscope (SEM) as a function of deposition time. An optical transmission of approximately 90% is observed for pure ZnO film having a resistivity of approximately 2.1 Omega-cm as measured by van der Pauw technique. Doping with Ga results in single phase ZnO:Ga films, retaining an optical transmission of about 80% and three orders of magnitude decrease in resistivity as compared to pure ZnO film.

  12. Structural defects and photoluminescence studies of sol-gel prepared ZnO and Al-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Sandeep, K. M.; Bhat, Shreesha; Dharmaprakash, S. M.

    2016-11-01

    ZnO and Al-doped ZnO (AZO) films were synthesized using sol-gel spin-coating method. The powder XRD analysis revealed the stress relaxation mechanism upon Al doping in ZnO film. The reduction in the imaginary part of the dielectric constant and suppression of deep level acceptor type octahedral oxygen interstitial defects account for the reduction in carrier concentration in AZO with respect to ZnO. Electrical conductivity measurements and grain boundary conduction model are used to quantify the carrier concentration. From the Commission Internationale d'Eclairge diagram of ZnO and AZO, color parameters like dominant wavelength, color purity and luminosity are determined and reported for the first time. The prepared ZnO and AZO films show considerable blue emission. These films can be used for white light generation.

  13. Oxidation Temperature Effects on ZnO Thin Films Prepared from Zn Thin Films on Quartz Substrates.

    PubMed

    Park, Seonhee; Kim, Younggyu; Leem, Jae-Young

    2015-11-01

    We investigated the structural and optical properties of the ZnO thin films formed by oxidation of Zn thin films. Zn thin films were deposited by thermal evaporation and were then annealed from 300 to 800 degrees C to prepare ZnO thin films. We found that ZnO thin films were formed by thermal oxidation of Zn thin films at oxidation temperatures over 400 degrees C. The grain size of ZnO thin films increased with the oxidation temperature and the highest ZnO (002) intensity was obtained at 600 degrees C. In the PL spectra, the intensity of the near-band-edge peak increased with the oxidation temperatures until 400 degrees C. However, these values gradually decreased with a further increase in the oxidation temperatures over 400 degrees C. The transmittance of the ZnO thin films was more than 90% for the visible wavelength region, and the optical band gap was red-shifted with increase in the oxidation temperature.

  14. Correlation Between Morphology and Nanomechanical Behavior of ZnO Thin Films

    NASA Astrophysics Data System (ADS)

    Sinha, Arijit; Mukherjee, Nillohit

    2016-10-01

    Influence of morphology of ZnO films on the mechanical properties at submicron scale was evaluated by nanoindentation to depict its adhesion with the substrate. ZnO films with three different morphologies viz. hexagonal rods, flakes and spheres were subjected to the analyses. The nanomechanical properties were found to be maximum and minimum for spherical and flake-like ZnO films, respectively. It has also been found that the average surface roughness (Ra) has significant influence on the nanomechanical properties.

  15. PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Zhang, B.; Yang, C.; Wang, J. Z.; Shi, L. Q.; Cheng, H. S.

    2014-08-01

    Cu-doped ZnO films were prepared by rf magnetron sputtering on sapphire substrate at different atmosphere. Microstructure of these films and Cu occupation sites were investigated using PIXE, SR-XRD and EXAFS. Only 2.9 at.% Cu, no other magnetic impurities (e.g., Fe, Co and Ni) were detected. The ZnO:Cu films possessed the wurtzite ZnO structures and no precipitates (e.g., CuO and Cu2O or Cu cluster) were found. Cu atoms were incorporated into ZnO crystal lattice by occupying Zn atomic sites.

  16. Comparative study of ZnO nanorods and thin films for chemical and biosensing applications and the development of ZnO nanorods based potentiometric strontium ion sensor

    NASA Astrophysics Data System (ADS)

    Khun, K.; Ibupoto, Z. H.; Chey, C. O.; Lu, Jun.; Nur, O.; Willander, M.

    2013-03-01

    In this study, the comparative study of ZnO nanorods and ZnO thin films were performed regarding the chemical and biosensing properties and also ZnO nanorods based strontium ion sensor is proposed. ZnO nanorods were grown on gold coated glass substrates by the hydrothermal growth method and the ZnO thin films were deposited by electro deposition technique. ZnO nanorods and thin films were characterised by field emission electron microscopy [FESEM] and X-ray diffraction [XRD] techniques and this study has shown that the grown nanostructures are highly dense, uniform and exhibited good crystal quality. Moreover, transmission electron microscopy [TEM] was used to investigate the quality of ZnO thin film and we observed that ZnO thin film was comprised of nano clusters. ZnO nanorods and thin films were functionalised with selective strontium ionophore salicylaldehyde thiosemicarbazone [ST] membrane, galactose oxidase, and lactate oxidase for the detection of strontium ion, galactose and L-lactic acid, respectively. The electrochemical response of both ZnO nanorods and thin films sensor devices was measured by using the potentiometric method. The strontium ion sensor has exhibited good characteristics with a sensitivity of 28.65 ± 0.52 mV/decade, for a wide range of concentrations from 1.00 × 10-6 to 5.00 × 10-2 M, selectivity, reproducibility, stability and fast response time of 10.00 s. The proposed strontium ion sensor was used as indicator electrode in the potentiometric titration of strontium ion versus ethylenediamine tetra acetic acid [EDTA]. This comparative study has shown that ZnO nanorods possessed better performance with high sensitivity and low limit of detection due to high surface area to volume ratio as compared to the flat surface of ZnO thin films.

  17. Oriented grain growth in ZnO thin films by Iodine doping

    NASA Astrophysics Data System (ADS)

    Thomas, Deepu; Vattappalam, Sunil C.; Mathew, Sunny; Augustine, Simon

    2015-02-01

    ZnO thin films were prepared by Successive Ionic Layer Adsorption Reaction (SILAR) method. Oriented grain growth in Iodine doped ZnO thin films were studied. The oriented grain growth in samples was studied by comparing the peak intensities from X-ray diffraction data and surface morphology by scanning electron microscopy. It is found that oriented grain growth significantly enhanced by Iodine doping. When the oriented grain growth increases, crystallinity of the thin film improves, resistance and band gap decrease. ZnO thin films having good crystallinity with preferential (002) orientation is a prerequisite for the fabrication of devices like UV diode lasers, acoustic- optic devices etc. A possible mechanism for the oriented grain growth is also investigated. It is inferred that creation of point defects is responsible for the enhanced oriented grain growth in ZnO thin films when doped with iodine.

  18. Atomic Oxygen Sensors Based on Nanograin ZnO Films Prepared by Pulse Laser Deposition

    SciTech Connect

    Wang Yunfei; Chen Xuekang; Li Zhonghua; Zheng Kuohai; Wang Lanxi; Feng Zhanzu; Yang Shengsheng

    2009-01-05

    High-quality nanograin ZnO thin films were deposited on c-plane sapphire (Al{sub 2}O{sub 3}) substrates by pulse laser deposition (PLD). Scanning electron microscopy (SEM) and x-ray diffraction (XRD) were used to characterize the samples. The structural and morphological properties of ZnO films under different deposition temperature have been investigated before and after atomic oxygen (AO) treatment. XRD has shown that the intensity of the (0 0 2) peak increases and its FWHM value decreases after AO treatment. The AO sensing characteristics of nano ZnO film also has been investigated in a ground-based atomic oxygen simulation facility. The results show that the electrical conductivity of nanograin ZnO films decreases with increasing AO fluence and that the conductivity of the films can be recovered by heating.

  19. Properties of antimony doped ZnO thin films deposited by spray pyrolysis technique

    SciTech Connect

    Sadananda Kumar, N. Bangera, Kasturi V.; Shivakumar, G. K.

    2015-07-15

    Antimony (Sb) doped zinc oxide (ZnO) thin films were deposited on the glass substrate at 450°C using spray pyrolysis technique. Effect of Sb doping on surface morphology structural, optical and electrical properties were studied. X-ray diffraction (XRD) analysis showed that both the undoped and doped ZnO thin films are polycrystalline in nature with (101) preferred orientation. SEM analysis showed a change in surface morphology of Sb doped ZnO thin films. Doping results in a marked increase in conductivity without affecting the transmittance of the films. ZnO films prepared with 3 at % Sb shows the lowest resistivity of 0.185 Ohm cm with a Hall mobility of 54.05 cm{sup 2} V{sup –1} s{sup –1}, and a hole concentration of 6.25 × 10{sup 17} cm{sup –3}.

  20. Fabrication of Vertical Organic Light-Emitting Transistor Using ZnO Thin Film

    NASA Astrophysics Data System (ADS)

    Yamauchi, Hiroshi; Iizuka, Masaaki; Kudo, Kazuhiro

    2007-04-01

    Organic light-emitting diodes (OLEDs) combined with thin film transistor (TFT) are well suitable elements for low-cost, large-area active matrix displays. On the other hand, zinc oxide (ZnO) is a transparent material and its electrical conductivity is controlled from conductive to insulating by growth conditions. The drain current of ZnO FET is 180 μA. The OLED uses ZnO thin film (Al-doped) for the electron injection layer and is controlled by radio frequency (rf) and direct current (dc) sputtering conditions, such as Al concentration and gas pressure. Al concentration in the ZnO film and deposition rate have strong effects on electron injection. Furthermore, the OLED driven by ZnO FET shows a luminance of 13 cd/m2, a luminance efficiency of 0.7 cd/A, and an on-off ratio of 650.

  1. Reliable thermal processing of organic perovskite films deposited on ZnO

    NASA Astrophysics Data System (ADS)

    Zakhidov, Alex; Manspeaker, Chris; Lyashenko, Dmitry; Alex Zakhidov Team

    Zinc oxide (ZnO) is a promising semiconducting material to serve as an electron transport layer (ETL) for solar cell devices based on organo-halide lead perovskites. ZnO ETL for perovskite photovoltaics has a combination of attractive electronic and optical properties: i) the electron affinity of ZnO is well aligned with valence band edge of the CH3NH3PbI3, ii) electron mobility of ZnO is >1 cm2/(Vs), which is a few orders of magnitude higher than that of TiO2 (another popular choice of ETL for perovskite photovoltaic devices), and iii) ZnO has a large of band gap of 3.3 eV, which ensures optical transparency and large barrier for the hole injection. Moreover, ZnO nanostructures can be printed on flexible substrates at room temperatures in cost effective manner. However, it was recently found that organic perovskites deposited on ZnO are unstable and readily decompose at >90°C. In this work, we further investigate the mechanism of decomposition of CH3NH3PbI3 film deposited on ZnO and reveal the role of the solvent in the film during the annealing process. We also develop a restricted volume solvent annealing (RVSA) process for post annealing of the perovskite film on ZnO without decomposition. We demonstrate that RVSA enables reliable perovskite solar cell fabrication.

  2. Optical properties of hybrid PEDOT-PSS: ZnO thin film

    NASA Astrophysics Data System (ADS)

    Zabidi, Z. M.; Alias, A. N.; Khalid, S. H.; Sahapini, N. F. M.

    2012-09-01

    Hybrid PEDOT-PSS: ZnO thin film have been prepared using drop casting method. The optical properties such as refractive index (n), extinction coefficient (k), reflectivity (R), optical dielectric loss, optical conductivity (σ), dispersion energy (Ed), oscillator energy (E0) and optical energy band gap (Eg) have been calculated in this paper. The determinations of optical constants have been made by applying the single-effective oscillator model proposed by Wemple and Didomenico Jr. We found that the reflectance is decreasing as the composition of ZnO increase. The refractive index of film also show significantly changes with the volume composition of ZnO. As the composition of ZnO increase, the refractive index shows the normal dispersion behavior. The extinction coefficient is decreasing with the increasing of wavelength, but as the wavelength increase from 400 nm until 700 nm, the extinction coefficient is also increasing. Both the real and imaginary part of the dielectric constant decrease as the photon energy increase. The oscillator energy Eo, dispersion energy Ed, optical band energy Eg were determined by using Wemple DiDomenico single-effective-oscillator model. It is shown that Eo is increasing as the composition of ZnO increase, Ed is decreasing as the composition of ZnO increase and Eg is increasing as the composition of ZnO increase. It is shown that the compositions of ZnO influence the optical properties of hybrid PEDOT-PSS: ZnO thin film.

  3. Morphological, physical, antimicrobial and release properties of ZnO nanoparticles-loaded bacterial cellulose films.

    PubMed

    Shahmohammadi Jebel, Fereshteh; Almasi, Hadi

    2016-09-20

    Bacterial cellulose (BC) monolayer and multilayer films, incorporating 5wt.% ZnO nanoparticles (NPs) have been obtained. Ultrasound (US) irradiation (40kHz) was applied during ZnO-BC nanocomposites preparation. X-ray diffraction (XRD) patterns showed that ZnO NPs were crystallized in their pure phase. SEM scanning electron microscopy (SEM) results indicated that US treatment causes to decrease ZnO particle size, forming a stable hybrid nanostructure and evenly distributed ZnO NPs coated BC nanofibers. ZnO NPs enhanced the mechanical properties and diminished water vapor permeability and moisture absorption of BC films. Antibacterial activity of ZnO-BC films against Staphylococcus aureus was more than Escherichia coli. The antibacterial activity was enhanced with the utilization of US irradiation. The ZnO release was influenced by films composition; the multilayer and US treated films being promising in order to achieve controlled release of ZnO. Results suggest that ZnO-BC films may be used as controlled release antimicrobial food active packaging.

  4. Formation of p-type ZnO thin film through co-implantation

    NASA Astrophysics Data System (ADS)

    Chuang, Yao-Teng; Liou, Jhe-Wei; Woon, Wei-Yen

    2017-01-01

    We present a study on the formation of p-type ZnO thin film through ion implantation. Group V dopants (N, P) with different ionic radii are implanted into chemical vapor deposition grown ZnO thin film on GaN/sapphire substrates prior to thermal activation. It is found that mono-doped ZnO by N+ implantation results in n-type conductivity under thermal activation. Dual-doped ZnO film with a N:P ion implantation dose ratio of 4:1 is found to be p-type under certain thermal activation conditions. Higher p-type activation levels (1019 cm-3) under a wider thermal activation range are found for the N/P dual-doped ZnO film co-implanted by additional oxygen ions. From high resolution x-ray diffraction and x-ray photoelectron spectroscopy it is concluded that the observed p-type conductivities are a result of the promoted formation of PZn-4NO complex defects via the concurrent substitution of nitrogen at oxygen sites and phosphorus at zinc sites. The enhanced solubility and stability of acceptor defects in oxygen co-implanted dual-doped ZnO film are related to the reduction of oxygen vacancy defects at the surface. Our study demonstrates the prospect of the formation of stable p-type ZnO film through co-implantation.

  5. Internal stress induced natural self-chemisorption of ZnO nanostructured films

    PubMed Central

    Chi, Po-Wei; Su, Chih-Wei; Wei, Da-Hua

    2017-01-01

    The energetic particles bombardment can produce large internal stress in the zinc oxide (ZnO) thin film, and it can be used to intentionally modify the surface characteristics of ZnO films. In this article, we observed that the internal stress increased from −1.62 GPa to −0.33 GPa, and the naturally wettability of the textured ZnO nanostructured films changed from hydrophobicity to hydrophilicity. According to analysis of surface chemical states, the naturally controllable wetting behavior can be attributed to hydrocarbon adsorbates on the nanostructured film surface, which is caused by tunable internal stress. On the other hand, the interfacial water molecules near the surface of ZnO nanostructured films have been identified as hydrophobic hydrogen structure by Fourier transform infrared/attenuated total reflection. Moreover, a remarkable near-band-edge emission peak shifting also can be observed in PL spectra due to the transition of internal stress state. Furthermore, our present ZnO nanostructured films also exhibited excellent transparency over 80% with a wise surface wetting switched from hydrophobic to hydrophilic states after exposing in ultraviolet (UV) surroundings. Our work demonstrated that the internal stress of the thin film not only induced natural wettability transition of ZnO nanostructured films, but also in turn affected the surface properties such as surface chemisorption. PMID:28233827

  6. Internal stress induced natural self-chemisorption of ZnO nanostructured films

    NASA Astrophysics Data System (ADS)

    Chi, Po-Wei; Su, Chih-Wei; Wei, Da-Hua

    2017-02-01

    The energetic particles bombardment can produce large internal stress in the zinc oxide (ZnO) thin film, and it can be used to intentionally modify the surface characteristics of ZnO films. In this article, we observed that the internal stress increased from ‑1.62 GPa to ‑0.33 GPa, and the naturally wettability of the textured ZnO nanostructured films changed from hydrophobicity to hydrophilicity. According to analysis of surface chemical states, the naturally controllable wetting behavior can be attributed to hydrocarbon adsorbates on the nanostructured film surface, which is caused by tunable internal stress. On the other hand, the interfacial water molecules near the surface of ZnO nanostructured films have been identified as hydrophobic hydrogen structure by Fourier transform infrared/attenuated total reflection. Moreover, a remarkable near-band-edge emission peak shifting also can be observed in PL spectra due to the transition of internal stress state. Furthermore, our present ZnO nanostructured films also exhibited excellent transparency over 80% with a wise surface wetting switched from hydrophobic to hydrophilic states after exposing in ultraviolet (UV) surroundings. Our work demonstrated that the internal stress of the thin film not only induced natural wettability transition of ZnO nanostructured films, but also in turn affected the surface properties such as surface chemisorption.

  7. Morphological and optical investigation of Sol-Gel ZnO films

    NASA Astrophysics Data System (ADS)

    Ivanova, T.; Harizanova, A.; Petrova, A.

    2016-03-01

    This paper presents morphological and optical studies of the properties of spin-coated ZnO films depending on the annealing temperatures. The films microstructure was explored using a scanning nano-hardness measuring device of the NanoScan family, based on the principles of atomic force microscopy, in a constant frequency mode. The surface study revealed that the root-mean-square (RMS) surface roughness of 985.64×985.64 nm ZnO films becomes greater with the increase of the annealing temperature, but the film surface remains uniform and smooth. The results were confirmed by XRD analysis, which demonstrated that the crystallite size grew from 25 to 36 nm with the thermal treatments. The ZnO films possessed high transmittance in the visible spectral range and the optical band gaps in ZnO films varied from 3.25 eV to 3.52 eV. The optical and morphological properties of the ZnO films formed on Si and quartz substrates are very good. The sol-gel approach proposed for deposition of nanostructured ZnO films is promising for applications in optoelectronic devices or solar cells.

  8. ZnO nanoparticles induced effects on nanomechanical behavior and cell viability of chitosan films

    PubMed Central

    Jayasuriya, Ambalangodage C.; Aryaei, Ashkan; Jayatissa, Ahalapitiya H.

    2014-01-01

    The aim of this paper is to develop novel chitosan-Zinc oxide nanocomposite films for biomedical applications. The films were fabricated with 1, 5, 10 and 15% w/w of Zinc Oxide (ZnO) nanoparticles (NPs) incorporated with chitosan (CS) using a simple method. The prepared nanocomposite films were characterized using atomic force microscopy, Raman and X-Ray diffraction studies. In addition, nano and micro mechanical properties were measured. It was found that the microhardness, nanohardness and its corresponding elastic modulus increased with the increasing of ZnO NPs percentage in the CS films. However, the ductility of films decreased as the percentage of ZnO NPs increased. Cell attachment and cytotoxicity of the prepared films at day two and five were evaluated in vitro using osteoblasts (OBs). It was observed that OB viability decreased in films with higher than 5% ZnO NPs. This result suggests that although ZnO NPs can improve the mechanical properties of pure CS films, only a low percentage of ZnO NPs can be applied for biomedical and bioengineering applications because of the cytotoxicity effects of these particles. PMID:23910265

  9. Controlling growth rate anisotropy for formation of continuous ZnO thin films from seeded substrates

    NASA Astrophysics Data System (ADS)

    Zhang, R. H.; Slamovich, E. B.; Handwerker, C. A.

    2013-05-01

    Solution-processed zinc oxide (ZnO) thin films are promising candidates for low-temperature-processable active layers in transparent thin film electronics. In this study, control of growth rate anisotropy using ZnO nanoparticle seeds, capping ions, and pH adjustment leads to a low-temperature (90 ° C) hydrothermal process for transparent and high-density ZnO thin films. The common 1D ZnO nanorod array was grown into a 2D continuous polycrystalline film using a short-time pure solution method. Growth rate anisotropy of ZnO crystals and the film morphology were tuned by varying the chloride (Cl-) ion concentration and the initial pH of solutions of zinc nitrate and hexamethylenetetramine (HMTA), and the competitive adsorption effects of Cl- ions and HMTA ligands on the anisotropic growth behavior of ZnO crystals were proposed. The lateral growth of nanorods constituting the film was promoted by lowering the solution pH to accelerate the hydrolysis of HMTA, thereby allowing the adsorption effects from Cl- to dominate. By optimizing the growth conditions, a dense ˜100 nm thickness film was fabricated in 15 min from a solution of [Cl-]/[Zn2+] = 1.5 and pH= 4.8 ± 0.1. This film shows >80% optical transmittance and a field-effect mobility of 2.730 cm2 V-1 s-1 at zero back-gate bias.

  10. Study of Doped ZnO Films Synthesized by Combining Vapor Gases and Pulsed Laser Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, Ching-Hua; Lehoczky, Sandor L.; George, M. A.

    2000-01-01

    The properties and structure of the ZnO material are similar to those of the GaN. Since an excitonic binding energy of ZnO is about 60 meV, it has strong potential for excitonic lasing at the room temperature. This makes synthesizing ZnO films for applications attractive. However, there are several hurdles in fabricating electro-optical devices from ZnO. One of those is in growing doped p-type ZnO films. Although techniques have been developed for the doping of both p-type and n-type ZnO, this remains an area that can be improved. In this presentation, we will report the experimental results of using both thermal vapor and pulsed laser deposition to grow doped ZnO films. The films are deposited on (0001) sapphire, (001) Si and quartz substrates by ablating a ZnO target. The group III and V elements are introduced into the growth chamber using inner gases. Films are characterized by x-ray diffraction, scanning probe microscopy, energy dispersive spectroscopy, Auger electron spectroscopy, and electrical measurements. The full width at half maximum of theta rocking curves for epitaxial films is less than 0.5 deg. In textured films, it rises to several degrees. Film surface morphology reveals an island growth pattern, but the size and density of these islands vary with the composition of the reactive gases. The electrical resistivity also changes with the doped elements. The relationship between the doping elements, gas composition, and film properties will be discussed.

  11. Synthesis and properties of Ag-doped ZnO films with room temperature ferromagnetism

    NASA Astrophysics Data System (ADS)

    Xu, Qin; Wang, Zhi-Jun; Chang, Ze-Jiang; Liu, Jing-Jin; Ren, Ya-Xuan; Sun, Hui-Yuan

    2016-12-01

    A series of Ag-doped ZnO films were prepared by DC magnetron sputtering. XRD and SEM results showed that the doping amount of Ag had a great influence on the films' morphology and ferromagnetism, and their magnetism can be improved by doping an appropriate amount of Ag. The theoretical analysis suggested that the magnetism resulted mainly from the film grain boundary surfaces. Further research revealed that these films had strong timeliness. Such a result indicated that the room temperature ferromagnetism of Ag-doped ZnO films did not stem from the cation vacancies but from the oxygen vacancies on the boundary surfaces.

  12. Investigation of sol-gel yttrium doped ZnO thin films: structural and optical properties

    NASA Astrophysics Data System (ADS)

    Ivanova, T.; Harizanova, A.; Koutzarova, T.; Vertruyen, B.

    2016-02-01

    Nanostructured metal oxide films are extensively studied due to their numerous applications such as optoelectronic devices, sensors. In this work, we report the Y-Zn-O nanostructured films prepared by sol-gel technology from sols with different concentration of yttrium precursor, followed by post-annealing treatment. The Y doped ZnO thin films have been deposited on Si and quartz substrates by spin coating method, then treated at temperatures ranging from 300-800oC. XRD analysis reveals modification of the film structure and phases in the doped ZnO films.

  13. Polarity Effects of Substrate Surface in Epitaxial ZnO Film Growth

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C.-H.; Lehoczky, S. L.; Harris, M. T.; Callahan, M. J.; George, M. A.; McCarty, P.

    1999-01-01

    Epitaxial ZnO films were grown on the two polar surfaces (0-face and Zn-face) of (0001) ZnO single crystal substrates using off-axis magnetron sputtering deposition. As a comparison, films are also deposited on the (000 I) Al203 substrates. It is found that the two polar surfaces have different photoluminescence (PL) spectrum, surface structure and morphology, which are strongly inference the epitaxial film growth. The morphology and structure of epitaxial films on the ZnO substrates are different from the film on the Al203 substrates. An interesting result shows that high temperature annealing of ZnO single crystals will improve the surface structure on the O-face surface rather than the opposite Surface. The measurements of PL, low-angle incident x-ray diffraction, and atomic force microscopy of ZnO films indicate that the O-terminated surface is better for ZnO epitaxial film growth using reactive sputtering deposition.

  14. Synthesis, structural and optical characterization of undoped, N-doped ZnO and co-doped ZnO thin films

    SciTech Connect

    Pathak, Trilok Kumar Kumar, R.; Purohit, L. P.

    2015-05-15

    ZnO, N-doped ZnO and Al-N co-doped ZnO thin films were deposited on ITO coated corning glass by spin coater using sol-gel method. The films were annealed in air at 450°C for one hour. The crystallographic structure and morphology of the films were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM) respectively. The X-ray diffraction results confirm that the thin films are of wurtzite hexagonal with a very small distortion. The optical properties were investigated by transmission spectra of different films using spectrophotometer (Shimadzu UV-VIS-NIR 3600). The results indicate that the N doped ZnO thin films have obviously enhanced transmittance in visible region. Moreover, the thickness of the films has strong influences on the optical constants.

  15. ZnO Thin Films Deposited on Textile Material Substrates for Biomedical Applications

    NASA Astrophysics Data System (ADS)

    Duta, L.; Popescu, A. C.; Dorcioman, G.; Mihailescu, I. N.; Stan, G. E.; Zgura, I.; Enculescu, I.; Dumitrescu, I.

    We report on the coating with ZnO adherent thin films of cotton woven fabrics by Pulsed laser deposition technique in order to obtain innovative textile materials, presenting protective effects against UV radiations and antifungal action.

  16. High-performance ZnO thin-film transistor fabricated by atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Oh, Byeong-Yun; Kim, Young-Hwan; Lee, Hee-Jun; Kim, Byoung-Yong; Park, Hong-Gyu; Han, Jin-Woo; Heo, Gi-Seok; Kim, Tae-Won; Kim, Kwang-Young; Seo, Dae-Shik

    2011-08-01

    We report the fabrication and characteristics of a ZnO thin-film transistor (TFT) using a 50 nm thick ZnO film as an active layer on an Al2O3 gate dielectric film deposited by atomic layer deposition. Lowering the deposition temperature allowed the control of the carrier concentration of the active channel layer (ZnO film) in the TFT device. The ZnO TFT fabricated at 110 °C exhibited high-performance TFT characteristics including a saturation field-effect mobility of 11.86 cm2 V-1 s-1, an on-to-off current ratio of 3.09 × 107 and a sub-threshold gate-voltage swing of 0.72 V decade-1.

  17. Light Control of Ferromagnetism in ZnO Films on Pt Substrate at Room Temperature

    PubMed Central

    Xie, Jihao; Qin, Hongwei; Hao, Yanming; Cheng, Bin; Liu, Weikang; Liu, Liang; Ren, Shaoqing; Zhou, Guangjun; Ji, Ziwu; Hu, Jifan

    2017-01-01

    The control of ferromagnetism by light at room temperature is essential for the development of some optical-magnetic coupling devices, data storage and quantum computation techniques. In the present work, we demonstrate that the ferromagnetism of a semiconducting ZnO film on Pt substrate can be controlled by nonpolarized ultraviolet or violet light. The illumination of light with sufficiently high frequency photons could excite photogenerated electron-hole pairs in the semiconducting ZnO film. The amount of oxygen vacancies in the ZnO film and the appearance of built-in electric field due to the heterostructured ZnO/Pt may play important roles in the light-induced changes in the ferromagnetism of the ZnO film. PMID:28393834

  18. Synthesis of Imine-Bearing ZnO Nanoparticle Thin Films and Characterization of Their Structural, Morphological and Optical Properties.

    PubMed

    Kaur, Narinder; Sharma, Sanjeev K; Kim, Deuk Young; Sharma, Hemant; Singh, Narinder

    2015-10-01

    We are presenting the first report on the fabrication of imine-bearing ZnO nanoparticle thin films grown on Corning glass by spin coating. The sol was prepared by dissolving imine-bearing ZnO nanoparticles in dimethylsulfoxide (DMSO). The thickness of the films was manipulated to be 125-200 nm. The X-ray diffraction (XRD) analysis showed hexagonal wurtzite structure of imine-bearing ZnO nanoparticles thin films with a (002) preferential orientation. The stretching of chemical bonds of the imine linkage and Zn-O in imine-bearing ZnO nanoparticle thin films was confirmed by Fourier transform infrared spectroscopy (FTIR). The grain size of the films increased with increasing the thickness of the films due to the number of coatings and subsequently dried at 200 °C. The transmittance of imine-bearing ZnO nanoparticle thin films was observed to be ≥94%, which was in close agreement to pure ZnO thin films in the visible region. The bandgap of imine-bearing ZnO nanoparticle thin films (3.04 eV), evaluated from Tauc's plot, was observed to be lower than that of pure ZnO (3.21 eV), which is attributed to the interaction of the ZnO nanoparticles with the imine receptor.

  19. Frictional Properties of UV illuminated ZnO Thin Films Grown by Pulsed Laser Deposition

    NASA Astrophysics Data System (ADS)

    Chiu, Hsiang-Chih; Chang, Huan-Pu; Lo, Fang-Yu; Yeh, Yu-Ting; Department of Physics, National Taiwan Normal University Collaboration

    Zinc Oxide (ZnO) nanostructures have potential applications in nano-electro-mechanical systems (NEMS) due to their unique physical properties. ZnO is also an excellent lubricant and hence a promising candidate for protective coatings in NEMS. By means of atomic force microscopy (AFM), we have investigated the frictional properties of ZnO thin films prepared by pulsed laser deposition technique. In addition, UV illumination is used to convert the surface wettability of ZnO thin films from being more hydrophobic to superhydrophilic via the photo-catalyst effect. We found that the frictional properties of the UV illuminated, superhydrophilic ZnO surface are strongly dependent on the environment humidity. While for hydrophobic ZnO, no such dependence is found. The observed frictional behaviors can be explained by the interplay between the surface roughness, environmental humidity and the presence of nanoscale capillary condensation forming between surface asperities at the tip-ZnO contact. Our results might find applications in future ZnO related NEMS. Frictional Properties of UV illuminated ZnO Thin Films Grown by Pulsed Laser Deposition.

  20. Study on Ni-doped ZnO films as gas sensors

    NASA Astrophysics Data System (ADS)

    Rambu, A. P.; Ursu, L.; Iftimie, N.; Nica, V.; Dobromir, M.; Iacomi, F.

    2013-09-01

    Ni doped ZnO films were obtained by spin coating, using zinc acetate and nickel acetate as starting materials and N,N-dimethylformamide as solvent. The X-ray diffraction (XRD) analysis indicates that, spin coated films posses a polycrystalline structure. Ni doped ZnO films are single phase and no trace of nickel metal or binary zinc nickel phases are observed. The values of some structural parameters (crystallite size, surface roughness) are varying with the variation of Ni concentration. The sensitivity of Ni:ZnO films, at three different gasses (ammonia, liquefied petroleum gas and ethanol) was investigated. Obtained results indicate that our films are most sensitive to ammonia, the operating temperature was found to be 190 °C and the response time is 35 s. The gas sensitivity was found to depend on the Ni concentration in ZnO films.

  1. Influence of surface defects in ZnO thin films on its biosensing response characteristic

    NASA Astrophysics Data System (ADS)

    Saha, Shibu; Gupta, Vinay

    2011-09-01

    Highly c-axis oriented zinc oxide (ZnO) thin films deposited by rf magnetron sputtering under varying processing pressure (20-50 mT) in a reactive gas mixture of argon and oxygen were studied for biosensing application. The as-deposited ZnO thin films were in a state of compressive stress having defects related to interstitial Zn and antisite oxygen. Glucose oxidase has been chosen as the model enzyme in the present study and was immobilized on the surface of ZnO thin films deposited on indium tin oxide coated Corning Glass substrate. The studies reveal a correlation between the biosensing characteristic and the presence of defects in the ZnO films. The ZnO films deposited under high pressure (50 mT) are found to be more sensitive for biosensing application due to availability of more surface area for effective immobilization of biomolecules and exhibits a suitable microenvironment with good electron transfer characteristic. The obtained results highlight the importance of desired microstate besides availability of suitable native defects in the ZnO thin film for exhibiting enhanced biosensing response.

  2. Water-repellent ZnO nanowires films obtained by octadecylsilane self-assembled monolayers

    NASA Astrophysics Data System (ADS)

    Badre, C.; Pauporté, T.; Turmine, M.; Dubot, P.; Lincot, D.

    2008-05-01

    Zinc oxide (ZnO) films with well-controlled morphologies have been prepared by electrochemical deposition. A seed layer of nanocrystallites of ZnO was prepared from which ZnO nanowires were grown from a low concentration of ZnCl 2. The nanowires are rough and dense and their superhydrophilicity is enhanced. A treatment with an alkylsilane (octadecylsilane) yields superhydrophobic surfaces with very high advancing and receding contact angles 173°/172° and a very low roll-off angle. Our superhydrophobic films are stable for more than 6 months.

  3. Growth of cluster assembled ZnO film by nanocluster beam deposition technique

    SciTech Connect

    Halder, Nilanjan

    2015-06-24

    ZnO is considered as one of the most promising material for optoelectronic devices. The present work emphasizes production of cluster assembled ZnO films by a UHV nanocluster beam deposition technique where the nanoclusters were produced in a laser vaporization cluster source. The microstructural and the optical properties of the ZnO nanocluster film deposited were investigated. As the wet chemical processes are not compatible with current solid state methods of device fabrication, therefore alternative UHV technique described in the paper is the need of the hour.

  4. Enhanced the photocatalytic activity of Ni-doped ZnO thin films: Morphological, optical and XPS analysis

    NASA Astrophysics Data System (ADS)

    Abdel-wahab, M. Sh.; Jilani, Asim; Yahia, I. S.; Al-Ghamdi, Attieh A.

    2016-06-01

    Pure and Ni-doped ZnO thin films with different concentration of Ni (3.5 wt%, 5 wt%, 7 wt%) were prepared by DC/RF magnetron sputtering technique. The X-rays diffraction pattern showed the polycrystalline nature of pure and Ni-doped ZnO thin films. The surface morphology of pure and Ni doped ZnO thin films were investigated through atomic force microscope, which indicated the increase in the grain dimension and surface roughness with increasing the Ni doping. The UV-Visible transmission spectra showed the decrease in the transmittance of doped ZnO thin films with the incorporation of Ni dopants. The surface and chemical state analysis of pure and Ni doped ZnO thin films were investigated by X-rays photoelectron spectroscopy (XPS). The photocatalytic activities were evaluated by an aqueous solution of methyl green dye. The tungsten lamp of 500 W was used as a source of visible light for photocatalytic study. The degradation results showed that the Ni-doped ZnO thin films exhibit highly enhanced photocatalytic activity as compared to the pure ZnO thin films. The enhanced photocatalytic activities of Ni-doped ZnO thin films were attributed to the enhanced surface area (surface defects), surface roughness and decreasing the band gap of Ni-doped ZnO thin films. Our work supports the applications of thin film metal oxides in waste water treatment.

  5. Performance improvement for solution-processed high-mobility ZnO thin-film transistors

    NASA Astrophysics Data System (ADS)

    Sha Li, Chen; Li, Yu Ning; Wu, Yi Liang; Ong, Beng S.; Loutfy, Rafik O.

    2008-06-01

    The fabrication technology of stable, non-toxic, transparent, high performance zinc oxide (ZnO) thin-film semiconductors via the solution process was investigated. Two methods, which were, respectively, annealing a spin-coated precursor solution and annealing a drop-coated precursor solution, were compared. The prepared ZnO thin-film semiconductor transistors have well-controlled, preferential crystal orientation and exhibit superior field-effect performance characteristics. But the ZnO thin-film transistor (TFT) fabricated by annealing a drop-coated precursor solution has a distinctly elevated linear mobility, which further approaches the saturated mobility, compared with that fabricated by annealing a spin-coated precursor solution. The performance of the solution-processed ZnO TFT was further improved when substituting the spin-coating process by the drop-coating process.

  6. Atomic layer deposition of Al-doped ZnO thin films

    SciTech Connect

    Tynell, Tommi; Yamauchi, Hisao; Karppinen, Maarit; Okazaki, Ryuji; Terasaki, Ichiro

    2013-01-15

    Atomic layer deposition has been used to fabricate thin films of aluminum-doped ZnO by depositing interspersed layers of ZnO and Al{sub 2}O{sub 3} on borosilicate glass substrates. The growth characteristics of the films have been investigated through x-ray diffraction, x-ray reflection, and x-ray fluorescence measurements, and the efficacy of the Al doping has been evaluated through optical reflectivity and Seebeck coefficient measurements. The Al doping is found to affect the carrier density of ZnO up to a nominal Al dopant content of 5 at. %. At nominal Al doping levels of 10 at. % and higher, the structure of the films is found to be strongly affected by the Al{sub 2}O{sub 3} phase and no further carrier doping of ZnO is observed.

  7. Highly textured and transparent RF sputtered Eu2O3 doped ZnO films.

    PubMed

    Sreedharan, Remadevi Sreeja; Ganesan, Vedachalaiyer; Sudarsanakumar, Chellappan Pillai; Bhavsar, Kaushalkumar; Prabhu, Radhakrishna; Mahadevan Pillai, Vellara Pappukutty Pillai

    2015-01-01

    Background : Zinc oxide (ZnO) is a wide, direct band gap II-VI oxide semiconductor. ZnO has large exciton binding energy at room temperature, and it is a good host material for obtaining visible and infrared emission of various rare-earth ions. Methods : Europium oxide (Eu2O3) doped ZnO films are prepared on quartz substrate using radio frequency (RF) magnetron sputtering with doping concentrations 0, 0.5, 1, 3 and 5 wt%. The films are annealed in air at a temperature of 773 K for 2 hours. The annealed films are characterized using X-ray diffraction (XRD), micro-Raman spectroscopy, atomic force microscopy, ultraviolet (UV)-visible spectroscopy and photoluminescence (PL) spectroscopy. Results : XRD patterns show that the films are highly c-axis oriented exhibiting hexagonalwurtzite structure of ZnO. Particle size calculations using Debye-Scherrer formula show that average crystalline size is in the range 15-22 nm showing the nanostructured nature of the films. The observation of low- and high-frequency E2 modes in the Raman spectra supports the hexagonal wurtzite structure of ZnO in the films. The surface morphology of the Eu2O3 doped films presents dense distribution of grains. The films show good transparency in the visible region. The band gaps of the films are evaluated using Tauc plot model. Optical constants such as refractive index, dielectric constant, loss factor, and so on are calculated using the transmittance data. The PL spectra show both UV and visible emissions. Conclusion : Highly textured, transparent, luminescent Eu2O3 doped ZnO films have been synthesized using RF magnetron sputtering. The good optical and structural properties and intense luminescence in the ultraviolet and visible regions from the films suggest their suitability for optoelectronic applications.

  8. Two aspects of thin film analysis: boron profile and scattering length density profile

    NASA Astrophysics Data System (ADS)

    Chen-Mayer, H. H.; Lamaze, G. P.; Coakley, K. J.; Satija, S. K.

    2003-06-01

    Boron/phosphorus-doped silicate glass (BPSG) thin films are widely used in microelectronic circuit devices. We employ two neutron techniques to investigate a 200-nm thick BPSG film: neutron depth profiling (NDP) and neutron reflectometry (NR) to obtain complementary information on the boron containing layer.

  9. Ohmic-Rectifying Conversion of Ni Contacts on ZnO and the Possible Determination of ZnO Thin Film Surface Polarity

    PubMed Central

    Saw, Kim Guan; Tneh, Sau Siong; Tan, Gaik Leng; Yam, Fong Kwong; Ng, Sha Shiong; Hassan, Zainuriah

    2014-01-01

    The current-voltage characteristics of Ni contacts with the surfaces of ZnO thin films as well as single crystal (0001) ZnO substrate are investigated. The ZnO thin film shows a conversion from Ohmic to rectifying behavior when annealed at 800°C. Similar findings are also found on the Zn-polar surface of (0001) ZnO. The O-polar surface, however, only shows Ohmic behavior before and after annealing. The rectifying behavior observed on the Zn-polar and ZnO thin film surfaces is associated with the formation of nickel zinc oxide (Ni1-xZnxO, where x = 0.1, 0.2). The current-voltage characteristics suggest that a p-n junction is formed by Ni1-xZnxO (which is believed to be p-type) and ZnO (which is intrinsically n-type). The rectifying behavior for the ZnO thin film as a result of annealing suggests that its surface is Zn-terminated. Current-voltage measurements could possibly be used to determine the surface polarity of ZnO thin films. PMID:24466144

  10. Surface Engineering of ZnO Thin Film for High Efficiency Planar Perovskite Solar Cells

    PubMed Central

    Tseng, Zong-Liang; Chiang, Chien-Hung; Wu, Chun-Guey

    2015-01-01

    Sputtering made ZnO thin film was used as an electron-transport layer in a regular planar perovskite solar cell based on high quality CH3NH3PbI3 absorber prepared with a two-step spin-coating. An efficiency up to 15.9% under AM 1.5G irradiation is achieved for the cell based on ZnO film fabricated under Ar working gas. The atmosphere of the sputtering chamber can tune the surface electronic properties (band structure) of the resulting ZnO thin film and therefore the photovoltaic performance of the corresponding perovskite solar cell. Precise surface engineering of ZnO thin film was found to be one of the key steps to fabricate ZnO based regular planar perovskite solar cell with high power conversion efficiency. Sputtering method is proved to be one of the excellent techniques to prepare ZnO thin film with controllable properties. PMID:26411577

  11. Impact of nanostructured thin ZnO film in ultraviolet protection.

    PubMed

    Sasani Ghamsari, Morteza; Alamdari, Sanaz; Han, Wooje; Park, Hyung-Ho

    2017-01-01

    Nanoscale ZnO is one of the best choices for ultraviolet (UV) protection, not only because of its antimicrobial properties but also due to its potential application for UV preservation. However, the behavior of nanostructured thin ZnO films and long-term effects of UV-radiation exposure have not been studied yet. In this study, we investigated the UV-protection ability of sol gel-derived thin ZnO films after different exposure times. Scanning electron microscopy, atomic force microscopy, and UV-visible optical spectroscopy were carried out to study the structure and optical properties of the ZnO films as a function of the UV-irradiation time. The results obtained showed that the prepared thin ZnO films were somewhat transparent under the visible wavelength region and protective against UV radiation. The UV-protection factor was 50+ for the prepared samples, indicating that they were excellent UV protectors. The deposited thin ZnO films demonstrated promising antibacterial potential and significant light absorbance in the UV range. The experimental results suggest that the synthesized samples have potential for applications in the health care field.

  12. Effects of synthesizing parameters on surface roughness and contact angles of ZnO nanowire films.

    PubMed

    Jing, Weixuan; Wang, Bing; Niu, Lingling; Jiang, Zhuangde; Qi, Han; Chen, Lujia; Zhou, Fan

    2014-06-01

    Effects of the synthesizing parameters on the surface roughness and the contact angles of ZnO nanowire films were studied in this paper. ZnO nanowire films were synthesized with the hydrothermal method on glass substrates, and the synthesizing parameters include the concentrations of the growth solution and the seed layer solution, the growth time span as well as the temperature. Atomic force microscopy and scanning electron microscopy were employed respectively to characterize the surface and the profile roughness of ZnO nanowire films. The measurement results by atomic force microscopy were in agreement with that by scanning electron microscopy, hence the former was used for the investigation of aforementioned effects. Relationships between the synthesizing parameters, the surface roughness and the contact angles of ZnO nanowire films were established, revealing that the synthesizing parameters affected significantly not only the surface roughness but also the contact angles of ZnO nanowire films. The results can be used for batch fabrication of ZnO nanowire-based structures and these structures-based sensors in a wide variety of applications.

  13. Impact of nanostructured thin ZnO film in ultraviolet protection

    PubMed Central

    Sasani Ghamsari, Morteza; Alamdari, Sanaz; Han, Wooje; Park, Hyung-Ho

    2017-01-01

    Nanoscale ZnO is one of the best choices for ultraviolet (UV) protection, not only because of its antimicrobial properties but also due to its potential application for UV preservation. However, the behavior of nanostructured thin ZnO films and long-term effects of UV-radiation exposure have not been studied yet. In this study, we investigated the UV-protection ability of sol gel-derived thin ZnO films after different exposure times. Scanning electron microscopy, atomic force microscopy, and UV-visible optical spectroscopy were carried out to study the structure and optical properties of the ZnO films as a function of the UV-irradiation time. The results obtained showed that the prepared thin ZnO films were somewhat transparent under the visible wavelength region and protective against UV radiation. The UV-protection factor was 50+ for the prepared samples, indicating that they were excellent UV protectors. The deposited thin ZnO films demonstrated promising antibacterial potential and significant light absorbance in the UV range. The experimental results suggest that the synthesized samples have potential for applications in the health care field. PMID:28096668

  14. Fabrication of highly transparent Al-ion-implanted ZnO thin films by metal vapor vacuum arc method

    NASA Astrophysics Data System (ADS)

    Lee, Han; Sivashanmugan, Kundan; Kao, Chi-Yuan; Liao, Jiunn-Der

    2017-03-01

    In this study, we utilized the metal vapor vacuum arc technique to implant vaporized aluminum (Al) ions in zinc oxide (ZnO) thin films. By adjusting the ion implantation dose and operational parameters, the conductivity and optical properties of the ZnO thin film can be controlled. The electrical sheet resistance of Al-ion-implanted ZnO decreased from 3.02 × 107 to 3.03 × 104 Ω/sq, while the transparency of the film was mostly preserved (91.5% at a wavelength of 550 nm). The ZnO thin-film Young’s modulus significantly increased with increasing Al ion dose.

  15. Thermoelectric Properties of Indium and Gallium Dually Doped ZnO Thin Films.

    PubMed

    Tran Nguyen, Nhat Hong; Nguyen, Truong Huu; Liu, Yi-Ren; Aminzare, Masoud; Pham, Anh Tuan Thanh; Cho, Sunglae; Wong, Deniz P; Chen, Kuei-Hsien; Seetawan, Tosawat; Pham, Ngoc Kim; Ta, Hanh Kieu Thi; Tran, Vinh Cao; Phan, Thang Bach

    2016-12-14

    We investigated the effect of single and multidopants on the thermoelectrical properties of host ZnO films. Incorporation of the single dopant Ga in the ZnO films improved the conductivity and mobility but lowered the Seebeck coefficient. Dual Ga- and In-doped ZnO thin films show slightly decreased electrical conductivity but improved Seebeck coefficient. The variation of thermoelectric properties is discussed in terms of film crystallinity, which is subject to the dopants' radius. Small amounts of In dopants with a large radius may introduce localized regions in the host film, affecting the thermoelectric properties. Consequently, a 1.5 times increase in power factor, three times reduction in thermal conductivity, and 5-fold enhancement in the figure of merit ZT have been achieved at 110 °C. The results also indicate that the balanced control of both electron and lattice thermal conductivities through dopant selection are necessary to attain low total thermal conductivity.

  16. Polarity enhancement in high oriented ZnO films on Si (100) substrate

    NASA Astrophysics Data System (ADS)

    Kurniawan, Robi; Nurfani, Eka; Muhammady, Shibghatullah; Sutjahja, Inge M.; Winata, Toto; Rusydi, Andrivo; Darma, Yudi

    2016-04-01

    Zinc oxide films with hexagonal crystal structures have been grown on Si substrate (100) using the DC-unbalanced magnetron sputtering at temperature of 300°C with growth time variation. The films have been characterized using X-Ray Diffraction and Fourier Transform Infrared measurement to show the crystal parameter and atomic bonding. The results show that the films have a dominant orientation in the hkl plane (002), while peak positions are shift to lower diffraction angle with addition of growth time. In addition, the bonding between Zn and O atoms (Zn-O) tend to be weaker as indicated by transmittance peak shifting to lower energy. The weakening of Zn-O bonding is due to the contribution of addition of bond length. These conditions make the films tend to have a high polarity. Further analysis of these studies will bring us to have a good undestanding to explain the ferroelectric properties of the ZnO films.

  17. Morphology and Structure of ZnO Films Synthesized by Off-Axis Sputtering Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C.-H.; Lehoczky, S. L.

    1999-01-01

    ZnO is a wide-band-gap oxide material that has many applications. A new potential application of ZnO material is for light emitting devices since its structure and electrical properties are similar to that of the GaN material (a blue laser candidate). It also is a good substrate for fabricating GaN-based devices. Off-axis sputtering technique has revealed great potential in synthesizing excellent oxide materials because the negative ion bombardment is greatly reduced when adatoms condense on substrates. The surface of films grown by off-axis sputtering will be much smoother than that produced in a regular sputtering configuration. A growth mechanism is studied by investigating the morphology and structure of ZnO films under different growth conditions and orientations. ZnO films are deposited on (0001) sapphire and quartz substrates by off- axis sputtering deposition at various oxygen/argon mixture ratios and pressures and at different temperatures. All films reveal highly textured structures on quartz substrates and epitaxial growth on sapphire substrates. Two off-axis configurations, vertical and horizontal orientations are conducted to study the process of film growth, surface morphology, and film structure. X-ray diffraction, scanning probe microscopy, and electrical measurements are used to characterize these films. Detailed results will be discussed in the presentation. Keywords: ZnO, Photonic material, Off-axis sputtering, Growth mechanism

  18. Modulation of ZnO film thickness and formation of water-hyacinth nanostructure

    NASA Astrophysics Data System (ADS)

    Gunasekaran, Ezhilarasan; Shankar, Prabakaran; Mani, Ganesh Kumar; Bosco Balaguru Rayappan, John

    2014-08-01

    The influence of precursor medium was investigated on the structural, morphological, optical and electrical properties of spray pyrolysis deposited nanostructured ZnO thin films. Three batches of ZnO thin films were deposited on glass substrates using three different solvents (water, water-ethanol [ratio of 1:1] and ethanol) based precursor solution of zinc nitrate hexahydrate. The substrate temperature was fixed at 523 K. The variation in film thickness from 150 to 875 nm was observed as the effect of changing solvent medium. X-ray diffraction (XRD) data confirmed the formation of polycrystalline ZnO thin films with hexagonal wurtzite crystallite structure and the estimated crystallite size was found to be ranging from 31 to 55 nm. Scanning electron micrographs revealed the formation of water-hyacinth shaped nanostructures when water-ethanol mixture was used as the solvent medium. Interestingly, UV-vis spectrophotometer revealed the formation of ZnO film with twin optical band gap of 3.15 eV and 3.56 eV when ethanol was used as the solvent medium. The modulation of film thickness and grain size by solvent medium has strongly influenced the electrical conductivity of ZnO thin films. The homogenous nano-spherical grains with uniform grain boundaries showed a good response towards 100 ppm of ammonia at room temperature.

  19. Gallium doping in transparent conductive ZnO thin films prepared by chemical spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Babar, A. R.; Deshamukh, P. R.; Deokate, R. J.; Haranath, D.; Bhosale, C. H.; Rajpure, K. Y.

    2008-07-01

    Zinc oxide (ZnO) and ZnO : Ga films have been deposited by the spray pyrolysis method onto preheated glass substrates using zinc acetate and gallium nitrate as precursors for Zn and Ga ions, respectively. The effect of Ga doping on the structural, morphological, optical and electrical properties of sprayed ZnO thin films were investigated using x-ray diffraction (XRD), scanning electron microscopy, optical absorption, photoluminescence (PL) and Hall effect techniques. XRD studies reveal that films are polycrystalline with hexagonal (wurtzite) crystal structure. The thin films were oriented along the (0 0 2) plane. Room temperature PL measurements indicate that the deposited films exhibit proper doping of Ga in ZnO lattice. The average transparency in the visible range was around ~85-95% for typical thin film deposited using 2 at% gallium doping. The optical band gap increased from 3.31 to 3.34 eV with Ga doping of 2 at%. The addition of gallium induces a decrease in electrical resistivity of the ZnO : Ga films up to 2 at% gallium doping. The highest figure of merit observed in this present study was 3.09 × 10-3 cm2 Ω-1.

  20. Photocatalytic activity and photocorrosion of atomic layer deposited ZnO ultrathin films for the degradation of methylene blue.

    PubMed

    Cao, Yan-Qiang; Chen, Jun; Zhou, Hang; Zhu, Lin; Li, Xin; Cao, Zheng-Yi; Wu, Di; Li, Ai-Dong

    2015-01-16

    ZnO ultrathin films with varied thicknesses of 7-70 nm were prepared at 200 °C on Si and fused quartz substrates by atomic layer deposition (ALD). The impact of film thickness and annealing temperature on the crystallinity, morphology, optical bandgap, and photocatalytic properties of ZnO in the degradation of methylene blue (MB) dye under UV light irradiation (λ = 365 nm) has been investigated deeply. The as-deposited 28 nm thick ZnO ultrathin film exhibits highest photocatalytic activity, ascribed to the smallest band gap of 3.21 eV and proper thickness. The photocorrosion effect of ALD ZnO ultrathin films during photocatalytic process is observed. The presence of MB significantly accelerates the dissolution of ZnO ultrathin films. The possible photoetching mechanism of ZnO in MB solution is proposed.

  1. Low temperature atomic layer deposited ZnO photo thin film transistors

    SciTech Connect

    Oruc, Feyza B.; Aygun, Levent E.; Donmez, Inci; Biyikli, Necmi; Okyay, Ali K.; Yu, Hyun Yong

    2015-01-01

    ZnO thin film transistors (TFTs) are fabricated on Si substrates using atomic layer deposition technique. The growth temperature of ZnO channel layers are selected as 80, 100, 120, 130, and 250 °C. Material characteristics of ZnO films are examined using x-ray photoelectron spectroscopy and x-ray diffraction methods. Stoichiometry analyses showed that the amount of both oxygen vacancies and interstitial zinc decrease with decreasing growth temperature. Electrical characteristics improve with decreasing growth temperature. Best results are obtained with ZnO channels deposited at 80 °C; I{sub on}/I{sub off} ratio is extracted as 7.8 × 10{sup 9} and subthreshold slope is extracted as 0.116 V/dec. Flexible ZnO TFT devices are also fabricated using films grown at 80 °C. I{sub D}–V{sub GS} characterization results showed that devices fabricated on different substrates (Si and polyethylene terephthalate) show similar electrical characteristics. Sub-bandgap photo sensing properties of ZnO based TFTs are investigated; it is shown that visible light absorption of ZnO based TFTs can be actively controlled by external gate bias.

  2. Optical properties of electrochemically deposited ZnO thin films on colloidal crystal film of SiO2 microspheres.

    PubMed

    Oh, Yong Taeg; Choi, Bum Ho; Shin, Dong Chan

    2012-02-01

    The optical properties of electrochemically deposited ZnO thin films on colloidal crystal film of SiO2 microspheres structures were studied. Colloidal crystal film of SiO2 microspheres were self-assembled by evaporation using SiO2 in solution at a constant 0.1 wt%. ZnO in thin films was then electrochemically deposited on to colloidal crystal film of SiO2 microspheres. During electrochemical deposition, the content of Zn(NO3)2 x 6H2O in solution was 5 wt%, and the process's conditions were varied between of 2-4 V and 30-120 s at room temperature, with subsequent heat-treatment between 200 and 400 degrees C. A smooth surface and uniform thickness of 1.8 microm were obtained at 3 V for 90 s. The highest PL peak intensity was obtained in the ZnO thin film heat-treated at 400 degrees C. The double layered ZnO/SiO2 colloidal crystals showed clearly better emission properties than the SiO2/ZnO and ZnO structures.

  3. N-doped ZnO films grown from hybrid target by the pulsed laser deposition technique

    NASA Astrophysics Data System (ADS)

    Martín-Tovar, E. A.; Chan y Díaz, E.; Acosta, M.; Castro-Rodríguez, R.; Iribarren, A.

    2016-10-01

    ZnO thin films were grown by the pulsed laser deposition technique on glass substrate using a hybrid target composed of ZnO powder embedded into a poly(ethyl cyanoacrylate) matrix. The resulting thin film presented ZnO wurtzite structure with very low stress and diffractogram very similar to that of the powder pattern. From comparing with ZnO thin films grown from traditional sintered target, it is suggested that the use of this hybrid target with a soft matrix led to ejection of ZnO clusters that conveniently disposed and adhered to substrate and previous deposited layers. Chemical measurements showed the presence of Zn-N bonds, besides Zn-O ones. Optical absorption profile confirmed the presence of low-polymerized zinc oxynitride molecular subunits, besides ZnO.

  4. Characterizations of multilayer ZnO thin films deposited by sol-gel spin coating technique

    NASA Astrophysics Data System (ADS)

    Khan, M. I.; Bhatti, K. A.; Qindeel, Rabia; Alonizan, Norah; Althobaiti, Hayat Saeed

    In this work, zinc oxide (ZnO) multilayer thin films are deposited on glass substrate using sol-gel spin coating technique and the effect of these multilayer films on optical, electrical and structural properties are investigated. It is observed that these multilayer films have great impact on the properties of ZnO. X-ray Diffraction (XRD) confirms that ZnO has hexagonal wurtzite structure. Scanning Electron Microscopy (SEM) showed the crack-free films which have uniformly distributed grains structures. Both micro and nano particles of ZnO are present on thin films. Four point probe measured the electrical properties showed the decreasing trend between the average resistivity and the number of layers. The optical absorption spectra measured using UV-Vis. showed the average transmittance in the visible region of all films is 80% which is good for solar spectra. The performance of the multilayer as transparent conducting material is better than the single layer of ZnO. This work provides a low cost, environment friendly and well abandoned material for solar cells applications.

  5. Characterization of ZnO films prepared by sol-gel method

    NASA Astrophysics Data System (ADS)

    Zhang, Jide; Sun, Xin; Qi, Tong; Ren, Ge; Shan, Yingyu; Dong, Qingya

    2017-03-01

    The ZnO thin films were prepared on an ordinary glass substrate using an optimized Sol-gel Method. X-ray diffraction patterns indicated that the grain size increased with increasing annealing temperature. The surface morphology of the films was also analyzed by atomic force microscopy get the same result. The UV-Vis absorption spectra showed that the band edge absorption at the ZnO band edge was strong, and the band gap of the film annealed at 450 °C was 3.29eV.

  6. Role of Ni doping on transport properties of ZnO thin films

    SciTech Connect

    Dar, Tanveer Ahmad Agrawal, Arpana; Sen, Pratima

    2015-06-24

    Nickel doped (Ni=0.05) and undoped Zinc Oxide (ZnO) thin films have been prepared by Pulsed laser deposition (PLD) technique. The structural analysis of the films was done by X-ray diffraction (XRD) studies which reveal absence of any secondary phase in the prepared samples. UV transmission spectra show that Ni doping reduces the transparency of the films. X-ray Photoelectron spectroscopy (XPS) also shows the presence of metallic Ni along with +2 oxidation state in the sample. Low temperature magneto transport properties of the ZnO and NiZnO films are also discussed in view of Khosla fisher model. Ni doping in ZnO results in decrease in magnitude of negative MR.

  7. Synthesis and Characterization of Molybdenum Doped ZnO Thin Films by SILAR Deposition Method

    NASA Astrophysics Data System (ADS)

    Radha, R.; Sakthivelu, A.; Pradhabhan, D.

    2016-08-01

    Molybdenum (Mo) doped zinc oxide (ZnO) thin films were deposited on the glass substrate by Successive Ionic Layer Adsorption and Reaction (SILAR) deposition method. The effect of Mo dopant concentration of 5, 6.6 and 10 mol% on the structural, morphological, optical and electrical properties of n-type Mo doped ZnO films was studied. The X-ray diffraction (XRD) results confirmed that the Mo doped ZnO thin films were polycrystalline with wurtzite structure. The field emission scanning electron microscopy (FESEM) studies shows that the surface morphology of the films changes with Mo doping. A blue shift of the optical band gap was observed in the optical studies. Effect of Mo dopant concentration on electrical conductivity was studied and it shows comparatively high electrical conductivity at 10 mol% of Mo doping concentration.

  8. A template-free CVD route to synthesize hierarchical porous ZnO films

    NASA Astrophysics Data System (ADS)

    Duan, Xiangyang; Chen, Guangde; Guo, Lu'an; Zhu, Youzhang; Ye, Honggang; Wu, Yelong

    2015-12-01

    Unique porous ZnO films were successfully synthesized on Si substrates without any catalysts or templates using chemical vapor deposition method. Unlike earlier reports, they are hierarchical porous, containing both macropores and mesopores. The zinc oxide seed layer and the weight ratio of source materials were found to be the major factors that would facilitate the synthesis of these hierarchical porous films. We found that all the macropores were surrounded by grain boundaries. As presented in the SEM images, the newborn ZnO atoms would prefer to adsorb nearby the grain boundaries and nucleate there in the growth stage. A schematic diagram based on the aforesaid phenomenon was proposed to explain the synthesis of the hierarchical porous ZnO film. An unusual strong emission peak located at 420 nm was observed in the photoluminescence spectrum. It was suggested that the emission peak was attributed to the special hierarchical porous structure, especially the grain boundaries in the nanowalls of these films.

  9. Mechanical and structural characterization of atomic layer deposition-based ZnO films

    NASA Astrophysics Data System (ADS)

    Tapily, K.; Gu, D.; Baumgart, H.; Namkoong, G.; Stegall, D.; Elmustafa, A. A.

    2011-11-01

    Zinc oxide thin films were deposited by atomic layer deposition (ALD). The structural and mechanical properties of the thin films were investigated by x-ray diffraction, transmission electron microscopy, atomic force microscopy, and nanoindentation. Diethyl zinc was used as the chemical precursor for zinc and water vapor was used as the oxidation agent. The samples were deposited at 150 °C and at a pressure of 2.1 × 10-1 Torr in the ALD reactor. A growth rate of 2 Å per cycle was calculated in the ALD process window. The Nano Indenter XP was used in conjunction with the continuous stiffness method in depth control mode in order to measure and to analyze the mechanical properties of hardness and modulus of ALD ZnO thin film samples. For comparison, we benchmarked the mechanical properties of single crystal bulk ZnO samples against those of our ALD ZnO thin films.

  10. Properties and characterization of bionanocomposite films prepared with various biopolymers and ZnO nanoparticles.

    PubMed

    Kanmani, Paulraj; Rhim, Jong-Whan

    2014-06-15

    This study was aimed to develop biopolymer based antimicrobial films for active food packaging and to reduce environmental pollution caused by accumulation of synthetic packaging. The ZnO NPs were incorporated as antimicrobials into different biopolymers such as agar, carrageenan and CMC. Solvent casting method was performed to prepare active nanocomposite films. Methods such as FE-SEM, FT-IR and XRD were used to characterize resulting films. Physical, mechanical, thermal and antimicrobial properties were also examined. Remarkable surface morphological differences were observed between control and nanocomposite films. The crystallinity of ZnO was confirmed by XRD analysis. The addition of ZnO NPs increased color, UV barrier, moisture content, hydrophobicity, elongation and thermal stability of the films, while decreased WVP, tensile strength and elastic modulus. ZnO NPs impregnated films inhibited growth of L. monocytogenes and E. coli. So these newly prepared nanocomposite films can be used as active packaging film to extend shelf-life of food.

  11. Effect of N2 flow during deposition on p-type ZnO film

    NASA Astrophysics Data System (ADS)

    Lin, Chiung-Wei; Liu, Bor-Chang

    2017-01-01

    In this study, the influence of a nitrogen source on p-type conductive ZnO films was studied. Rapid thermal oxidation was conducted to oxidize ZnN films and convert them to ZnO films. When an as-deposited ZnN film was prepared at a high nitrogen gas flow rate, the converted ZnO film possessed many acceptors and showed stable p-type conduction. This p-type conduction was attributed to the nitrogen gas flow providing many “No” states, which act as acceptors within the processed ZnO film. It was found that the as-deposited ZnN film prepared at a high nitrogen gas flow rate is oxidized slightly so that only a few nitrogen atoms were replaced by oxygen. The carrier concentration and mobility of the optimized oxidized ZnN film were 9.76 × 1017 cm-3 and 62.78 cm2 V-1 s-1, respectively. A good rectified current-voltage characteristic with a turn-on voltage of 3.65 V was achieved for the optimized ZnO:N/ZnO junction.

  12. The enhancement of oxygen sensitivity of ZnO macropore film by functionalizing with azo pigment.

    PubMed

    Peng, Liang; Zhai, Jiali; Wang, Dejun; Zhang, Yu; Zhao, Qidong; Wang, Ping; Pang, Shan; Fan, Zhiyong; Xie, Tengfeng

    2009-06-01

    Azo-ZnO hybrid films were prepared by functionalizing the ZnO macropore films with azo pigment (1,1'-(biphenyl-4,4'-diylbis(diazene-2,1-diyl))dinaphthalen-2-ol). Scanning electronic microscopy, current-voltage, UV-Vis absorption spectroscopy and Kelvin probe were used to characterize these films. The oxygen sensing characteristics of hybrid films and pure ZnO film were measured under the irradiation of UV light. The results show that the sensitivity of hybrid film is about 500 times higher than that of pure ZnO film. The high sensitivity to oxygen of hybrid films is mainly attributed to the increasing of the photo-generated electron concentration. Enhanced photo-induced charge separation after functionalization is confirmed by the pattern of transient photovoltage. Our results demonstrate that the functionalization with azo pigment is a promising approach to enhance the oxygen sensitivity of ZnO under the irradiation of UV light.

  13. Highly transparent and luminescent nanostructured EU2O3 doped ZnO films

    NASA Astrophysics Data System (ADS)

    Sreeja Sreedharan, R.; Ganasan, V.; Sudarsanakumar, C.; Prabhu, Radhakrishna; Mahadevan Pillai, V. P.

    2014-08-01

    Zinc oxide is a wide, direct band gap II-VI oxide semiconductor. Pure and Eu-doped ZnO films are prepared by RF Magnetron sputtering at different doping concentrations (0.5, 1, 3 and 5 wt %). The films are annealed at 500 0C in air for two hours. The structural, morphological and optical properties of the films are characterized using XRD, micro-Raman, AFM, UV-Visible and photoluminescence spectroscopy. The thickness of the films is measured using stylus profilometer. XRD analysis shows that all the films are highly c-axis oriented exhibiting a single peak corresponding to (002) lattice reflection plane of hexagonal wurtzite crystal phase of ZnO. The micro-Raman spectra analysis reveals the presence of E2 high mode in all the samples which is the intrinsic characteristic of hexagonal wurtzite structure of ZnO. The appearance of LO modes indicates the formation of defects such as oxygen vacancies in the films. AFM micrographs show uniform distribution of densely packed grains of size with well defined grain boundaries. All the films exhibit very high transmittance (above 80%) in the visible region with a sharp fundamental absorption edge around 380 nm corresponding to the intrinsic band edge of ZnO. All the films show PL emission in the UV and visible region.

  14. Optimization of pulsed laser deposited ZnO thin-film growth parameters for thin-film transistors (TFT) application

    NASA Astrophysics Data System (ADS)

    Gupta, Manisha; Chowdhury, Fatema Rezwana; Barlage, Douglas; Tsui, Ying Yin

    2013-03-01

    In this work we present the optimization of zinc oxide (ZnO) film properties for a thin-film transistor (TFT) application. Thin films, 50±10 nm, of ZnO were deposited by Pulsed Laser Deposition (PLD) under a variety of growth conditions. The oxygen pressure, laser fluence, substrate temperature and annealing conditions were varied as a part of this study. Mobility and carrier concentration were the focus of the optimization. While room-temperature ZnO growths followed by air and oxygen annealing showed improvement in the (002) phase formation with a carrier concentration in the order of 1017-1018/cm3 with low mobility in the range of 0.01-0.1 cm2/V s, a Hall mobility of 8 cm2/V s and a carrier concentration of 5×1014/cm3 have been achieved on a relatively low temperature growth (250 °C) of ZnO. The low carrier concentration indicates that the number of defects have been reduced by a magnitude of nearly a 1000 as compared to the room-temperature annealed growths. Also, it was very clearly seen that for the (002) oriented films of ZnO a high mobility film is achieved.

  15. Mn2+ ions distribution in doped sol-gel deposited ZnO films

    NASA Astrophysics Data System (ADS)

    Stefan, Mariana; Ghica, Daniela; Nistor, Sergiu V.; Maraloiu, Adrian V.; Plugaru, Rodica

    2017-02-01

    The localization and distribution of the Mn2+ ions in two sol-gel deposited ZnO films doped with different manganese concentrations were investigated by electron paramagnetic resonance spectroscopy and analytical transmission electron microscopy. In the lightly doped sample the Mn2+ ions are mainly localized substitutionally at isolated tetrahedrally coordinated Zn2+ sites in both crystalline ZnO nanograins (34%) and surrounding disordered ZnO (52%). In the highly doped ZnO film, a much smaller proportion of manganese substitutes Zn2+ in the crystalline and disordered ZnO (10%). The main amount (85%) of manganese aggregates in a secondary phase as an insular-like distribution between the ZnO nanograins. The remaining Mn2+ ions (14% and 5% at low and high doping levels, respectively) are localized at isolated, six-fold coordinated sites, very likely in the disordered intergrain region. Annealing at 600 °C induced changes in the Mn2+ ions distribution, reflecting the increase of the ZnO crystallization degree, better observed in the lightly doped sample.

  16. High performance thin film transistor with ZnO channel layer deposited by DC magnetron sputtering.

    PubMed

    Moon, Yeon-Keon; Moon, Dae-Yong; Lee, Sang-Ho; Jeong, Chang-Oh; Park, Jong-Wan

    2008-09-01

    Research in large area electronics, especially for low-temperature plastic substrates, focuses commonly on limitations of the semiconductor in thin film transistors (TFTs), in particular its low mobility. ZnO is an emerging example of a semiconductor material for TFTs that can have high mobility, while a-Si and organic semiconductors have low mobility (<1 cm2/Vs). ZnO-based TFTs have achieved high mobility, along with low-voltage operation low off-state current, and low gate leakage current. In general, ZnO thin films for the channel layer of TFTs are deposited with RF magnetron sputtering methods. On the other hand, we studied ZnO thin films deposited with DC magnetron sputtering for the channel layer of TFTs. After analyzing the basic physical and chemical properties of ZnO thin films, we fabricated a TFT-unit cell using ZnO thin films for the channel layer. The field effect mobility (micro(sat)) of 1.8 cm2/Vs and threshold voltage (Vth) of -0.7 V were obtained.

  17. Annealing effect on the property of ultraviolet and green emissions of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Kang, Hong Seong; Kang, Jeong Seok; Kim, Jae Won; Lee, Sang Yeol

    2004-02-01

    The mechanism of ultraviolet (UV) and green emission of ZnO thin films deposited on (001) sapphire substrates by pulsed laser deposition was investigated by using postannealing treatment at various annealing temperatures after deposition. Structural, electrical, and optical properties of ZnO films have been also observed. As the postannealing temperature increased, the intensity of UV (380 nm) peak and the carrier concentration were decreased while the intensity of the visible (about 490-530 nm) peak and the resistivity were increased. The role of oxygen in ZnO thin film during the annealing process was important to the change of optical properties. The mechanism of the luminescence suggested that UV luminescence of ZnO thin film was related to the transition from near band edge to valence band, and green luminescence of ZnO thin film was caused by the transition from deep donor level to valence band due to oxygen vacancies. The activation energy derived by using the variation of green emission intensity was 1.19 eV.

  18. Growth of Polarity-Controlled ZnO Films on (0001) Al2O3

    NASA Astrophysics Data System (ADS)

    Park, J. S.; Chang, J. H.; Minegishi, T.; Lee, H. J.; Park, S. H.; Im, I. H.; Hanada, T.; Hong, S. K.; Cho, M. W.; Yao, T.

    2008-05-01

    The polarity control of ZnO films grown on (0001) Al2O3 substrates by plasma-assisted molecular-beam epitaxy (P-MBE) was achieved by using a novel CrN buffer layer. Zn-polar ZnO films were obtained by using a Zn-terminated CrN buffer layer, while O-polar ZnO films were achieved by using a Cr2O3 layer formed by O-plasma exposure of a CrN layer. The mechanism of polarity control was proposed. Optical and structural quality of ZnO films was characterized by high-resolution X-ray diffraction and photoluminescence (PL) spectroscopy. Low-temperature PL spectra of Zn-polar and O-polar samples show dominant bound exciton (I8) and strong free exciton emissions. Finally, one-dimensional periodic structures consisting of Zn-polar and O-polar ZnO films were simultaneously grown on the same substrate. The periodic inversion of polarity was confirmed in terms of growth rate, surface morphology, and piezo response microscopy (PRM) measurement.

  19. Influence of Substrate Nature and Annealing on Electro-Optical Properties of ZnO Thin Films

    SciTech Connect

    Iacomi, Felicia; Baban, C.; Prepelita, Petronela; Luca, D.; Iftimie, Nicoleta

    2007-04-23

    ZnO thin films were grown on different substrates (glass, quartz, silicon wafers, etc) by vacuum thermal evaporation. Different thermal treatments were performed in order to obtain transparent and conductive or high resistive ZnO thin films. The optical and electrical properties of ZnO thin films are dependent on the crucible temperature, annealing conditions and on the substrate nature. The thin films are transparent and have an electrical resistivity in 10-4 {omega}m regio. The annealing process performed in vacuum at 573K or under UV irradiation determines a decrease in the electrical resistivity of films.

  20. Boron doped nanostructure ZnO films deposited by ultrasonic spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Karakaya, Seniye; Ozbas, Omer

    2015-02-01

    ZnO is an II-VI compound semiconductor with a wide direct band gap of 3.3 eV at room temperature. Doped with group III elements (B, Al or Ga), it becomes an attractive candidate to replace tin oxide (SnO2) or indium tin oxide (ITO) as transparent conducting electrodes in solar cell devices and flat panel display due to competitive electrical and optical properties. In this work, ZnO and boron doped ZnO (ZnO:B) films have been deposited onto glass substrates at 350 ± 5 °C by a cost-efficient ultrasonic spray pyrolysis technique. The optical, structural, morphological and electrical properties of nanostructure undoped and ZnO:B films have been investigated. Electrical resistivity of films has been analyzed by four-probe technique. Optical properties and thicknesses of the films have been examined in the wavelength range 1200-1600 nm by using spectroscopic ellipsometry (SE) measurements. The optical constants (refractive index (n) and extinction coefficient (k)) and the thicknesses of the films have been fitted according to Cauchy model. The optical method has been used to determine the band gap value of the films. Transmission spectra have been taken by UV spectrophotometer. It is found that both ZnO and ZnO:B films have high average optical transmission (≥80%). X-ray diffraction (XRD) patterns indicate that the obtained ZnO has a hexagonal wurtzite type structure. The morphological properties of the films were studied by atomic force microscopy (AFM). The surface morphology of the nanostructure films is found to depend on the concentration of B. As a result, ZnO:B films are promising contender for their potential use as transparent window layer and electrodes in solar cells.

  1. Using the hydrothermal method to grow p-type ZnO nanowires on Al-doped ZnO thin film to fabricate a homojunction diode.

    PubMed

    Tseng, Yung-Kuan; Hung, Meng-Chun; Su, Shun-Lung; Li, Sheng-Kai

    2014-10-01

    In this study, the hydrothermal method is used to grow phosphorus-doped ZnO nanowires on Si/SiO2 substrates deposited with Al-doped ZnO thin film. This structure forms a homogeneous p-n junction. In this study, we are the pioneers to use ammonium hypophosphite (NH4H2PO2) as a source of phosphorus to prepare the precursor solution. Ammonium hypophosphite of different concentration levels is used to observe its effects on the growth of nanowires. The results show that the precursor solution prepared from ammonium hypophosphite can produce good crystalline ZnO nanowires while there is no linear relationship between the amounts and concentration levels of phosphorus doped into the nanowires. Whether the phosphorus-doped ZnO nanowires have the characteristics of a p-type semiconductor is indirectly verified by measuring whether the p-n junction made up of Al-doped ZnO thin film and phosphorus-doped ZnO nanowires shows rectifying behavior. I-V measurements are made on the specimens. The results show good rectifying behavior, proving that the phosphorus-doped ZnO nanowires and Al-doped AZO films have p-type and n-type semiconductor properties, constituting a good p-n junction. This result also proves that ammonium hypophosphite is a better source of phosphorus in the hydrothermal method to synthesize phosphorus-doped ZnO nanowires.

  2. Characterization of ZnO Thin Films Prepared by Thermal Oxidation of Zn

    NASA Astrophysics Data System (ADS)

    Bouanane, I.; Kabir, A.; Boulainine, D.; Zerkout, S.; Schmerber, G.; Boudjema, B.

    2016-07-01

    Zinc oxide thin films were prepared by thermal oxidation of zinc films at a temperature of 500°C for 2 h. The Zn films were deposited onto glass substrates by magnetron RF sputtering. The sputtering time varied from 2.5 min to 15 min. The physico-chemical characterization of the ZnO films was carried out depending on the Zn sputtering time. According to x-ray diffraction, ZnO films were polycrystalline and the Zn-ZnO phase transformation was direct. The mean transmittance of the ZnO films was around 80% and the band gap increased from 3.15 eV to 3.35 eV. Photoluminescence spectra show ultraviolet, visible, and infrared emission bands. The increase of the UV emission band was correlated with the improvement of the crystalline quality of the ZnO films. The concentration of native defects was found to decrease with increasing Zn sputtering time. The decrease of the electrical resistivity as a function of Zn sputtering time was linked to extrinsic hydrogen-related defects.

  3. Intrinsic and extrinsic origins of room temperature ferromagnetism in Ni-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Liu, X. J.; Zhu, X. Y.; Song, C.; Zeng, F.; Pan, F.

    2009-02-01

    The structural, electrical and magnetic properties of Ni-doped ZnO films with different Ni concentrations (x = 0-0.11, x: Ni concentration) and thicknesses (d = 15-330 nm, d: film thickness) prepared by radio-frequency magnetron sputtering have been systematically investigated. The structural characterizations indicate that Ni ions in the 2+ valence state, uniformly distributed in the film, almost substitute for the Zn ions when x <= 0.07, whereas when x increases up to 0.11, a second phase Ni is formed. Room temperature (RT) ferromagnetism (FM) has been observed for all the Ni-doped ZnO wurtzite films. The saturated magnetization varies drastically with the Ni concentration and the film thickness. A large magnetic moment of 2.80 μB/Ni is obtained in the 15 nm thick Zn0.96Ni0.04O film at RT. The results show that the FM observed is intrinsic for Ni-doped ZnO films and can be explained in terms of the bound magnetic polaron mechanism based on the presence of defects. In addition, the Ni precipitates owing to the excessive doping of Ni in ZnO, as an extrinsic origin, also contribute to the ferromagnetic properties in highly doped samples.

  4. Piezoelectricity of ZnO Films Prepared by Sol-Gel Method

    NASA Astrophysics Data System (ADS)

    Zhang, Ke-ming; Zhao, Ya-pu; He, Fa-quan; Liu, Dong-qing

    2007-12-01

    ZnO piezoelectric thin films were prepared on crystal substrate Si(111) by sol-gel technology, then characterized by scanning electron microscopy, X-ray diffraction and atomic force microscopy (AFM). The ZnO films characterized by X-ray diffraction are highly oriented in (002) direction with the growing of the film thickness. The morphologies, roughness and grain size of ZnO film investigated by AFM show that roughness and grain size of ZnO piezoelectric films decrease with the increase of the film thickness. The roughness dimension is 2.188-0.914 nm. The piezoelectric coefficient d33 was investigated with a piezo-response force microscope (PFM). The results show that the piezoelectric coefficient increases with the increase of thickness and (002) orientation. When the force reference is close to surface roughness of the films, the piezoelectric coefficient measured is inaccurate and fluctuates in a large range, but when the force reference is big, the piezoelectric coefficient d33 changes little and ultimately keeps constant at a low frequency.

  5. Electrical and optical properties of Ti doped ZnO films grown on glass substrate by atomic layer deposition

    SciTech Connect

    Wan, Zhixin; Kwack, Won-Sub; Lee, Woo-Jae; Jang, Seung-II; Kim, Hye-Ri; Kim, Jin-Woong; Jung, Kang-Won; Min, Won-Ja; Yu, Kyu-Sang; Park, Sung-Hun; Yun, Eun-Young; Kim, Jin-Hyock; Kwon, Se-Hun

    2014-09-15

    Highlights: • Ti doped ZnO films were prepared on Corning XG glass substrate by ALD. • The electrical properties and optical properties were systematically investigated. • An optimized Ti doped ZnO films had low resistivity and excellent optical transmittance. - Abstract: Titanium doped zinc oxide (Ti doped ZnO) films were prepared by atomic layer deposition methods at a deposition temperature of 200 °C. The Ti content in Ti doped ZnO films was varied from 5.08 at.% to 15.02 at.%. X-ray diffraction results indicated that the crystallinity of the Ti doped ZnO films had degraded with increasing Ti content. Transmission electron microscopy was used to investigate the microstructural evolution of the Ti doped ZnO films, showing that both the grain size and crystallinity reduced with increasing Ti content. The electrical resistivity of the Ti doped ZnO films showed a minimum value of 1.6 × 10{sup −3} Ω cm with the Ti content of 6.20 at.%. Furthermore, the Ti doped ZnO films exhibited excellent transmittance.

  6. Third generation biosensing matrix based on Fe-implanted ZnO thin film

    SciTech Connect

    Saha, Shibu; Gupta, Vinay; Sreenivas, K.; Tan, H. H.; Jagadish, C.

    2010-09-27

    Third generation biosensor based on Fe-implanted ZnO (Fe-ZnO) thin film has been demonstrated. Implantation of Fe in rf-sputtered ZnO thin film introduces redox center along with shallow donor level and thereby enhance its electron transfer property. Glucose oxidase (GOx), chosen as model enzyme, has been immobilized on the surface of the matrix. Cyclic voltammetry and photometric assay show that the prepared bioelectrode, GOx/Fe-ZnO/ITO/Glass is sensitive to the glucose concentration with enhanced response of 0.326 {mu}A mM{sup -1} cm{sup -2} and low Km of 2.76 mM. The results show promising application of Fe-implanted ZnO thin film as an attractive matrix for third generation biosensing.

  7. Photoluminescence lifetime of Al-doped ZnO films in visible region

    NASA Astrophysics Data System (ADS)

    Sharma, Bhupendra K.; Khare, Neeraj; Haranath, D.

    2010-12-01

    ZnO and Al-doped ZnO films have been deposited on quartz substrates by ultrasonically assisted chemical vapor deposition technique. Photoluminescence (PL) spectra of the films reveal that Al doping leads to suppression of defect related visible band. Time resolved photoluminescence studies have been carried out for the measurement of lifetime of deep level luminescence. The decay of PL intensity with time has been found to follow biexponential behavior. The relative contributions of fast decay component (τ1) and slow decay component (τ2) in total decay process are found to be ˜99% and ˜1% respectively. The values of τ1 and τ2 are found to decrease with Al doping in ZnO film. The decrease of both τ1 and τ2 is attributed to increase in non-radiative recombination due to reduction in grain sizes and the decrease in radiative recombination due to suppression of defects.

  8. Functionalization of nanostructured ZnO films by copper-free click reaction.

    PubMed

    Cao, Yan; Galoppini, Elena; Reyes, Pavel Ivanoff; Lu, Yicheng

    2013-06-25

    The copper-free click reaction was explored as a surface functionalization methodology for ZnO nanorod films grown by metal organic chemical vapor deposition (MOCVD). 11-Azidodecanoic acid was bound to ZnO nanorod films through the carboxylic acid moiety, leaving the azide group available for Cu-free click reaction with alkynes. The azide-functionalized layer was reacted with 1-ethynylpyrene, a fluorescent probe, and with alkynated biotin, a small biomolecule. The immobilization of pyrene on the surface was probed by fluorescence spectroscopy, and the immobilization of biotin was confirmed by binding with streptavidin-fluorescein isothiocyanate (streptavidin-FITC). The functionalized ZnO films were characterized by Fourier transform infrared attenuated total reflectance (FTIR-ATR), steady-state fluorescence emission, fluorescence microscopy, and field emission scanning electron microscopy (FESEM).

  9. Laser ablated ZnO thin film for amperometric detection of urea

    NASA Astrophysics Data System (ADS)

    Batra, Neha; Tomar, Monika; Jain, Prateek; Gupta, Vinay

    2013-09-01

    Zinc oxide (ZnO) thin films deposited onto indium tin oxide (ITO) coated corning glass substrates using pulsed laser deposition (PLD) technique at two different oxygen pressures (50 mT and 100 mT) have been used as efficient matrix for realization of efficient urea biosensors after immobilization of urease (Urs) enzyme onto ZnO film surface. The bioelectrode Urs/ZnO/ITO/glass having ZnO matrix grown at 100 mT is found to be exhibiting an enhanced sensitivity of 36 μΑ mΜ-1 cm-2 for urea over a wide detection range of 5-200 mg/dl. The relatively low value of Michaelis-Menten constant (Km = 0.82 mM) indicates high affinity of the immobilized urease towards the analyte (urea). The prepared sensor exhibits high selectivity towards detection of urea and retains 90% of its activity for more than 12 weeks. The observed enhanced response characteristics of bioelectrode is attributed to the growth of highly c-axis oriented ZnO thin film by PLD at 100 mT oxygen pressure with desired rough and porous surface morphology besides high electron communication feature. The results confirm the promising application of PLD grown ZnO thin film as an efficient matrix for urea detection.

  10. Electrochemically deposited nanostructured ZnO thin films for biosensor applications

    NASA Astrophysics Data System (ADS)

    Bhadane, Hemalata; Samuel, Edmund; Gautam, D. K.

    2014-04-01

    Zinc Oxide thin films have been deposited by electrochemical method on stainless steel using Zinc nitrate hexahydrate as precursor and 0.05 M potassium chloride (KCl) as supporting electrolyte. The paper reveals thorough investigation of effect of concentration of Zinc nitrate. Further, morphological, structural and optical analysis has been carried out using the FESEM, XRD and PL spectroscopy respectively. From FESEM hexagonal shape nanorods ZnO films fabricated for 1 hour using 0.05M and 0.1M concentration are clearly observed. The XRD of ZnO thin films shows strong peaks along c-axis with (0 0 2) orientation of ZnO nanorods which implies deposited nanorods are perpendicular to the substrate surface and wurtzite hexagonal phase. The hexagonal ZnO nanorod grown using a 0.05M zinc nitrate concentration exhibited the sharpest and most intense PL peak in at 382 nm near UV band edge, indicates the enhanced crystalline structure of ZnO film.

  11. Random lasing of ZnO thin films grown by pulsed-laser deposition

    NASA Astrophysics Data System (ADS)

    Cachoncinlle, C.; Hebert, C.; Perrière, J.; Nistor, M.; Petit, A.; Millon, E.

    2015-05-01

    Low-dimensional semiconductor structures on nanometer scale are of great interest because of their strong potential applications in nanotechnologies. We report here optical and structural properties on UV lasing in ZnO thin films. The ZnO films, 110 nm thick, were prepared using pulsed-laser deposition on c-cut sapphire substrates at 500 °C under 10-2 oxygen pressure. The ZnO films are nearly stoichiometric, dense and display the wurtzite phase. The films are highly textured along the ZnO c-axis and are constituted of nanocrystallites. According to Hall measurements these films are conductive (0.11 Ω cm). Photoluminescence measurements reveals a so-called random lasing in the range 390 to 410 nm, when illuminating at 355 nm with a tripled frequency pulsed Nd-YAG laser. Such random lasing is obtained at rather low optical pumping, 45 kW cm-2, a value lower than those classically reported for pulsed-laser deposition thin films.

  12. Structural, Electrical, and Optical Properties of ZnO Film Used as Buffer Layer for CIGS Thin-Film Solar Cell.

    PubMed

    Choi, Eun Chang; Cha, Ji-Hyun; Jung, Duk-Young; Hong, Byungyou

    2016-05-01

    The CuIn(x)Ga(1-x)Se2 (CIGS) using the solution-based fabrication method is attractive for thin film solar cells because of its possibilities for large-area and low-cost production. ZnO films between transparent conductive oxide (TCO) and the CdS films can improve the performances of CIGS thin-film solar cells. In this study, we investigated the characteristics of ZnO film between TCO and CIGS layers in a solar cell (AZO/ZnO/CdS/CIGS/Mo), which were deposited at various thicknesses to investigate the role of the films in CIGS solar cells. It was confirmed that the conversion efficiency of a CIGS solar cell depends on the ZnO film. For a ZnO film thickness of 80 nm, the highest power conversion efficiency that a solar cell achieved was J(sc) of 18.73 mA/cm2.

  13. Construction of (001) facets exposed ZnO nanosheets on magnetically driven cilia film for highly active photocatalysis

    NASA Astrophysics Data System (ADS)

    Peng, Fengping; Zhou, Qiang; Lu, Chunhua; Ni, Yaru; Kou, Jiahui; Xu, Zhongzi

    2017-02-01

    ZnO nanosheet arrays with exposed (001) facets have been constructed onto a biomimetic inner-motile film, using a seed-mediated hydrothermal growth technology without adding capping agents. The growth of ZnO nanoparticles along the [001] direction is impeded because of a physical steric hindrance, and therefore (001) planes are left behind as the dominant crystal facets. In comparison to ZnO nanorod arrays film, the photocatalytic activity of the actuated (001) facets exposed ZnO nanosheet arrays film is dramatically improved to approximately 2.48 times. Moreover, when it is subjected to a rotational magnetic field, the ZnO nanosheet arrays film is driven to mimic ciliary motion like nature beating cilia, which can boost the interior mass transfer and help to promote release of active sites for improving the photocatalytic activity. As a consequence of the exposed (001) high active facets, the singular ability of microfluidic manipulation has greater effect on ZnO nanosheet arrays films. The enhancement of photocatalytic activity of the actuated ZnO nanosheet arrays film is much more than that of ZnO nanorod arrays film.

  14. Fabrication and Characterization of High-Crystalline Nanoporous ZnO Thin Films by Modified Thermal Evaporation System

    NASA Astrophysics Data System (ADS)

    Islam, M. S.; Hossain, M. F.; Razzak, S. M. A.; Haque, M. M.; Saha, D. K.

    2016-05-01

    The aim of this work is to fabricate high-crystalline nanoporous zinc oxide (ZnO) thin films by a modified thermal evaporation system. First, zinc thin films have been deposited on bare glass substrate by the modified thermal evaporation system with pressure of 0.05mbar, source-substrate distance of 3cm and source temperature 700∘C. Then, high-crystalline ZnO thin film is obtained by annealing at 500∘C for 2h in atmosphere. The prepared ZnO films are characterized with various deposition times of 10min and 20min. The structural property was investigated by X-ray diffractometer (XRD). The optical bandgap and absorbance/transmittance of these films are examined by ultraviolet/visible spectrophotometer. The surface morphological property has been observed by scanning electron microscope (SEM). ZnO films have showed uniform nanoporous surface with high-crystalline hexagonal wurtzite structure. The ZnO films prepared with 20min has excitation absorption-edge at 369nm, which is blueshifted with respect to the bulk absorption-edge appearing at 380nm. The gap energy of ZnO film is decreased from 3.14eV to 3.09eV with increase of the deposition time, which can enhance the excitation of ZnO films by the near visible light, and is suitable for the application of photocatalyst of waste water cleaning and polluted air purification.

  15. CdS quantum dots sensitized Cu doped ZnO nanostructured thin films for solar cell applications

    NASA Astrophysics Data System (ADS)

    Poornima, K.; Gopala Krishnan, K.; Lalitha, B.; Raja, M.

    2015-07-01

    ZnO nanorods and Cu doped ZnO nanorods thin films have been prepared by simple hydrothermal method. CdS quantum dots are sensitized with Cu doped ZnO nanorod thin films using successive ionic layer adsorption and reaction (SILAR) method. The X-ray diffraction study reveals that ZnO nanorods, and CdS quantum dot sensitized Cu doped ZnO nanorods exhibit hexagonal structure. The scanning electron microscope image shows the presence of ZnO nanorods. The average diameter and length of the aligned nanorod is 300 nm and 1.5 μm respectively. The absorption spectra shows that the absorption edge of CdS quantum dot sensitized ZnO nanorod thin film is shifted toward longer wavelength region when compared to the absorption edge of ZnO nanorods film. The conversion efficiency of the CdS quantum dot sensitized Cu doped ZnO nanorod thin film solar cell is 1.5%.

  16. Disposable urea biosensor based on nanoporous ZnO film fabricated from omissible polymeric substrate.

    PubMed

    Rahmanian, Reza; Mozaffari, Sayed Ahmad; Abedi, Mohammad

    2015-12-01

    In the present study, a facile and simple fabrication method of a semiconductor based urea biosensor was reported via three steps: (i) producing a ZnO-PVA composite film by means of a polymer assisted electrodeposition of zinc oxide (ZnO) on the F-doped SnO2 conducting glass (FTO) using water soluble polyvinyl alcohol (PVA), (ii) obtaining a nanoporous ZnO film by PVA omission via a subsequent post-treatment by annealing of the ZnO-PVA film, and (iii) preparation of a FTO/ZnO/Urs biosensor by exploiting a nanoporous ZnO film as an efficient and excellent platform area for electrostatic immobilization of urease enzyme (Urs) which was forced by the difference in their isoelectric point (IEP). The characterization techniques focused on the analysis of the ZnO-PVA film surfaces before and after annealing, which had a prominent effect on the porosity of the prepared ZnO film. The surface characterization of the nanostructured ZnO film by a field emission-scanning electron microscopy (FE-SEM), exhibited a film surface area as an effective bio-sensing matrix for enzyme immobilization. The structural characterization and monitoring of the biosensor fabrication was performed using UV-Vis, Fourier Transform Infrared (FT-IR), Raman Spectroscopy, Thermogravimetric Analysis (TGA), Cyclic Voltammetry (CV), and Electrochemical Impedance Spectroscopy (EIS) techniques. The impedimetric results of the FTO/ZnO/Urs biosensor showed a high sensitivity for urea detection within 8.0-110.0mg dL(-1) with the limit of detection as 5.0mg dL(-1).

  17. Structural, optical and electronic properties of Fe doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Singh, Karmvir; Devi, Vanita; Dhar, Rakesh; Mohan, Devendra

    2015-09-01

    Fe doped ZnO thin films have been deposited by pulsed laser deposition technique on quartz substrate to study structural, optical and electronic structure using XRD, AFM, UV-visible and X-ray absorption spectroscopy. XRD study reveals that Fe doping has considerable effect on stress, strain, grain size and crystallinity of thin films. UV-visible study determines that band gap of pristine ZnO decreases with Fe doping, which can be directly correlated to transition tail width and grain size. Change in electronic structure with Fe doping has been examined by XAS study.

  18. Physical and electrochemical properties of ZnO films fabricated from highly cathodic electrodeposition potentials

    NASA Astrophysics Data System (ADS)

    Ismail, Abdul Hadi; Abdullah, Abdul Halim; Sulaiman, Yusran

    2017-03-01

    The physical and electrochemical properties of zinc oxide (ZnO) film electrode that were prepared electrochemically were studied. ZnO was electrodeposited on ITO glass substrate by applying three different highly cathodic potentials (-1.3 V, -1.5 V, -1.7 V) in a solution containing 70 mM of Zn(NO3)2.xH2O and 0.1 M KCl with bath temperatures of 70 °C and 80 °C. The presence of ZnO was asserted from XRD analysis where the corresponding peaks in the spectra were assigned. SEM images revealed the plate-like hexagonal morphology of ZnO which is in agreement with the XRD analysis. The areal capacitance of the ZnO was observed to increase when the applied electrodeposition potential is increased from -1.3 V to -1.5 V. However, the areal capacitance is found to decrease when the applied electrodeposition potential is further increased to -1.7 V. The resistance of charge transfer (Rct) of the ZnO decreased when the applied electrodeposition potential varies from -1.3 V to -1.7 V due to the decreased particle size of ZnO when more cathodic electrodeposition potential is applied.

  19. Pulse laser deposited nanostructured ZnO thin films: a review.

    PubMed

    Kumar, Rajesh; Kumar, Girish; Umar, Ahmad

    2014-02-01

    This review summarizes the work principles of pulse laser deposition (PLD) apparatus, physical processes like ablation, and plasma plume formation accompanying the deposition of un-doped ZnO from target to substrate material. Various modes of deposition and factors influencing the properties of thin films such as substrate temperature, background gas pressure, laser energy density (laser fluence), target to substrate distance, repetition rate, oxygen partial pressure in deposition chamber, deposition time and post growth annealing which control deposition parameters such as adsorption, desorption, surface diffusion, nucleation, and crystallization/re-crystallization are also discussed in this review. Moreover, various film properties such as morphology, roughness of the film surface, film thickness, grain size, optical transmittance, sensitivity, electrical conductivity, uniformity and electrical resistivity of the deposited ZnO thin films have also been enumerated in the present review.

  20. Microstructure and optical properties of nitrogen-doped ZnO film

    NASA Astrophysics Data System (ADS)

    Zhao, Xian-Wei; Gao, Xiao-Yong; Chen, Xian-Mei; Chen, Chao; Zhao, Meng-Ke

    2013-02-01

    The nitrogen doping of ZnO film deposited by the magnetron sputtering method is subsequently realized by the hydrothermal synthesis method. The nitrogen-doped ZnO film is preferably (002) oriented. With the increase of hexamethylenetetramine (HMT) solution concentration, the average grain size of the film along the <002> direction almost immediately decreases and then monotonously increases, conversely, the lattice strain first increases and then decreases. The structural evolution of the film surface from compact and even to sparse and rough is attributed to the enhanced nitrogen doping content in the hydrothermal process. The transmission and photoluminescence properties of the film are closely related to grain size, lattice strain, and nitrogen-related defect arising from the enhanced nitrogen doping content with HMT concentration increasing.

  1. Mechanical and transparent conductive properties of ZnO and Ga-doped ZnO films sputtered using electron-cyclotron-resonance plasma on polyethylene naphtalate substrates

    SciTech Connect

    Akazawa, Housei

    2014-03-15

    Transparent conductive ZnO and Ga-doped ZnO (GZO) films were deposited on polyethylene naphtalate (PEN) sheet substrates using electron cyclotron resonance plasma sputtering. Both ZnO and GZO films were highly adhesive to the PEN substrates without inserting an intermediate layer in the interface. When compared at the same thickness, the transparent conductive properties of GZO films on PEN substrates were only slightly inferior to those on glass substrates. However, the carrier concentration of ZnO films on PEN substrates was 1.5 times that of those on glass substrates, whereas their Hall mobility was only 60% at a thickness of 300 nm. The depth profile of elements measured by secondary ion mass spectroscopy revealed the diffusion of hydrocarbons out of the PEN substrate into the ZnO film. Hence, doped carbons may act as donors to enhance carrier concentration, and the intermixing of elements at the interface may deteriorate the crystallinity, resulting in the lower Hall mobility. When the ZnO films were thicker than 400 nm, cracks became prevalent because of the lattice mismatch strain between the film and the substrate, whereas GZO films were free of cracks. The authors investigated how rolling the films around a cylindrical pipe surface affected their conductive properties. Degraded conductivity occurred at a threshold pipe radius of 10 mm when tensile stress was applied to the film, but it occurred at a pipe radius of 5 mm when compressive stress was applied. These values are guidelines for bending actual devices fabricated on PEN substrates.

  2. Synthesis and conductivity enhancement of Al-doped ZnO nanorod array thin films.

    PubMed

    Hsu, Chih-Hsiung; Chen, Dong-Hwang

    2010-07-16

    Al-doped ZnO (AZO) nanorod array thin films with various Al/Zn molar ratios were synthesized by chemical bath deposition. The resultant AZO nanorods were well-aligned at the glass substrate, growing vertically along the c-axis [001] direction. In addition, they had an average diameter of 64.7 +/- 16.8 nm and an average length of about 1.0 microm with the structure of wurtzite-type ZnO. Analyses of energy dispersive x-ray spectra and x-ray photoelectron spectra indicated that Al atoms had been doped into the ZnO crystal lattice. The doping of Al atoms did not result in significant changes in the structure and crystal orientation, but the electrical resistivity was found to increase first and then decrease with increasing Al content owing to the increase of carrier concentration and the decrease of mobility. In addition, the transmission in the visible region increased but the increase was reduced at higher Al doping levels. After hydrogen treatment, the morphology of the AZO nanorod array thin films remained unchanged. However, the electrical resistivity decreased significantly due to the formation of oxygen vacancies and interstitial hydrogen atoms. When the real Al/Zn molar ratio was about 3.7%, the conductivity was enhanced about 1000 times and a minimum electrical resistivity of 6.4 x 10( - 4) Omega cm was obtained. In addition, the transmission of the ZnO nanorod array thin film in the visible region was significantly increased but the increase was less significant for the AZO nanorod array thin film, particularly at higher Al doping levels. In addition, the current-voltage curves of the thin film devices with ZnO or AZO nanorod arrays revealed that AZO had a higher current response than ZnO and hydrogen treatment led to a more significant enhancement of current responses (about 100-fold).

  3. Pulsed laser deposition of ZnO grown on glass substrates for realizing high-performance thin-film transistors

    NASA Astrophysics Data System (ADS)

    Yoshida, T.; Tachibana, T.; Maemoto, T.; Sasa, S.; Inoue, M.

    2010-12-01

    We report characterization of ZnO thin-film transistors (TFTs) on glass substrates fabricated by pulsed laser deposition (PLD). ZnO films were characterized by X-ray diffraction (XRD), atomic force microscopy and Hall effect measurements. The XRD results showed high c-axis-oriented ZnO(0002) diffraction corresponding to the wurtzite phase. Moreover, the crystallization and the electrical properties of ZnO thin films grown at room temperature are controllable by PLD growth conditions such as oxygen gas pressure. The ZnO films are very smooth, with a root-mean-square roughness of 1 nm. From the Hall effect measurements, we have succeeded in fabricating ZnO films on glass substrates with an electron mobility of 21.7 cm2/V s. By using the ZnO thin film grown by two-step PLD and a HfO2 high- k gate insulator, a transconductance of 24.1 mS/mm, a drain current on/off ratio of 4.4×106 and a subthreshold gate swing of 0.26 V/decade were obtained for the ZnO TFT.

  4. Photocatalytic efficiency of reusable ZnO thin films deposited by sputtering technique

    NASA Astrophysics Data System (ADS)

    Ahumada-Lazo, R.; Torres-Martínez, L. M.; Ruíz-Gómez, M. A.; Vega-Becerra, O. E.; Figueroa-Torres, M. Z.

    2014-12-01

    The photocatalytic activity of ZnO thin films with different physicochemical characteristics deposited by RF magnetron sputtering on glass substrate was tested for the decolorization of orange G dye aqueous solution (OG). The crystalline phase, surface morphology, surface roughness and the optical properties of these ZnO films were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), atomic force microscopy (AFM) and UV-visible spectroscopy (UV-Vis), respectively. The dye photodecolorization process was studied at acid, neutral and basic pH media under UV irradiation of 365 nm. Results showed that ZnO films grow with an orientation along the c-axis of the substrate and exhibit a wurtzite crystal structure with a (002) preferential crystalline orientation. A clear relationship between surface morphology and photocatalytic activity was observed for ZnO films. Additionally, the recycling photocatalytic abilities of the films were also evaluated. A promising photocatalytic performance has been found with a very low variation of the decolorization degree after five consecutive cycles at a wide range of pH media.

  5. Pulsed laser deposited cobalt-doped ZnO thin film

    NASA Astrophysics Data System (ADS)

    Wang, Li; Su, Xue-qiong; Lu, Yi; Chen, Jiang-bo

    2013-09-01

    To realize the room-temperature ferromagnetism (RTFM) in diluted magnetic semiconductors (DMS), we prepared a series of Cobalt-doped ZnO thin films using pulsed laser deposition (PLD) at deposition temperatures 500°C under oxygen pressure from 2.5×10-4 Pa to 15 Pa. To elucidate the physical origin of RTFM, Co 2p spectra of cobalt-doped ZnO thin films was measured by X-ray photoelectron spectroscopy (XPS). The magnetic properties of films were measured by an alternating gradient magnetometer (AGM), and the electrical properties were detected by a Hall Effect instrument using the Van der Pauw method. XPS analysis shows that the Co2+ exists and Co clusters and elemental content change greatly in samples under various deposition oxygen pressures. Not only the valence state and elemental content but also the electrical and magnetic properties were changed. In the case of oxygen pressure 10 Pa, an improvement of saturation magnetic moment about one order of magnitude over other oxygen pressure experiments, and the film exhibits ferromagnetism with a curie temperature above room temperature. It was found that the value of carrier concentration in the Co-doped ZnO film under oxygen pressure 10Pa increases about one order of magnitude than the values of other samples under different oxygen pressure. Combining XPS with AGM measurements, we found that the ferromagnetic signals in cobalt-doped ZnO thin film deposited at 500 °C under oxygen pressure 10 Pa only appear with the detectable Co2+ spectra from incompletely oxidized Co metal or Co cluster. So oxygen pressure 10 Pa can be thought the best condition to obtain room-temperature dilute magnetic semiconductor about cobalt-doped ZnO thin films.

  6. Preparation of Ni doped ZnO thin films by SILAR and their characterization

    NASA Astrophysics Data System (ADS)

    Mondal, S.; Mitra, P.

    2013-02-01

    Pure and nickel (Ni) doped zinc oxide (NZO) thin films were deposited on glass substrates from ammonium zincate bath using successive ion layer adsorption and reaction (SILAR). Characterization techniques such as XRD, TEM, SEM and EDX were utilized to investigate the effect of Ni doping on the microstructure of Ni:ZnO thin films. Structural characterization by X-ray diffraction reveals the polycrystalline nature of the films. Particle size shows slightly decreasing trend with increasing nickel impurification. The average particle size for pure ZnO is 22.75 nm and it reduces to 20.51 nm for 10 % Ni doped ZnO. Incorporation of Ni was confirmed from elemental analysis using EDX. The value of fundamental absorption edge is 3.23 eV for pure ZnO and it decreases to 3.19 eV for 10 % Ni:ZnO. The activation energy barrier value to electrical conduction process increases from 0.261 eV for pure ZnO to 0.293 eV for 10 % Ni doped ZnO.

  7. Pressure Effect in ZnO Films Using Off-Axis Sputtering Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, C.-H.; Lehoczky, S. L.; Peters, P.; George, M. A.

    1999-01-01

    ZnO films are deposited on (0001) sapphire, (001) Si and quartz substrates using the off-axis reactive magnetron sputtering deposition. Based on film thickness measurements, three transport regions of sputtered particles are observed when films are deposited in the pressure regions of 5 mtorr - 150 mtorr. X-ray diffraction, scanning probes microscopy, and electrical measurements are also used to characterize these films. The full width at half maximum of theta rocking curves for epitaxial films is less than 0.5 deg. In textured films, it rises to several degrees. The epitaxial films deposited at high pressure reveal a flat surface with some hexagonal facets. The density of hexagonal facets decreases when the growth pressure is reduced. The resistivity of these epitaxial films also depends on the growth pressures. A relationship between the pressure effects and film properties are discussed.

  8. A comparative study of physico-chemical properties of CBD and SILAR grown ZnO thin films

    SciTech Connect

    Jambure, S.B.; Patil, S.J.; Deshpande, A.R.; Lokhande, C.D.

    2014-01-01

    Graphical abstract: Schematic model indicating ZnO nanorods by CBD (Z{sub 1}) and nanograins by SILAR (Z{sub 2}). - Highlights: • Simple methods for the synthesis of ZnO thin films. • Comparative study of physico-chemical properties of ZnO thin films prepared by CBD and SILAR methods. • CBD outperforms SILAR method. - Abstract: In the present work, nanocrystalline zinc oxide (ZnO) thin films have been successfully deposited onto glass substrates by simple and economical chemical bath deposition (CBD) and successive ionic layer adsorption reaction (SILAR) methods. These films were further characterized for their structural, optical, surface morphological and wettability properties. The X-ray diffraction (XRD) patterns for both CBD and SILAR deposited ZnO thin films reveal the highly crystalline hexagonal wurtzite structure. From optical studies, band gaps obtained are 2.9 and 3.0 eV for CBD and SILAR deposited thin films, respectively. The scanning electron microscope (SEM) patterns show growth of well defined randomly oriented nanorods and nanograins on the CBD and SILAR deposited samples, respectively. The resistivity of CBD deposited films (10{sup 2} Ω cm) is lower than that of SILAR deposited films (10{sup 5} Ω cm). Surface wettability studies show hydrophobic nature for both films. From the above results it can be concluded that CBD grown ZnO thin films show better properties as compared to SILAR method.

  9. Development and surface characterization of a glucose biosensor based on a nanocolumnar ZnO film

    NASA Astrophysics Data System (ADS)

    Rodrigues, A.; Castegnaro, M. V.; Arguello, J.; Alves, M. C. M.; Morais, J.

    2017-04-01

    Highly oriented nanostructured ZnO films were grown on the surface of stainless steel plates (ZnO/SS) by chemical bath deposition (CBD). The films consisted of vertically aligned ZnO nanocolumns, ∼1 μm long and ∼80 nm wide, as observed by SEM (scanning electron microscopy) and FIB (focused ion beam). XRD (X-ray diffraction) confirmed the c-axis preferred orientation of the ZnO columns, which were functionalized with the glucose oxidase (GOx) enzyme into a biosensor of glucose. The electrochemical response studied by CV (cyclic voltammetry) proved that the biosensor was capable of detecting glucose from 1.5 up to 16 mM concentration range. XPS (X-ray photoelectron spectroscopy) analysis, excited with synchrotron radiation, probed the atom specific chemical environment at the electrode's surface and shed some light on the nature of the ZnO-GOx interaction.

  10. Photopatternable nano-composite (SU-8/ZnO) thin films for piezo-electric applications

    NASA Astrophysics Data System (ADS)

    Kandpal, Manoj; Sharan, Chandrashekhar; Poddar, Pankaj; Prashanthi, K.; Apte, Prakash R.; Ramgopal Rao, V.

    2012-09-01

    Photo-curable nanocomposite material was formulated by embedding ZnO nanoparticles into a SU-8 matrix and studied for its piezoelectric properties for low cost fabrication of self-powered nanodevices. The piezoelectric coefficient of ZnO nanoparticles was observed to be ranging between 15 and 23 pm/V, which is the highest reported. These experimental studies support the recent theoretical predictions where the piezoelectric coefficients in ZnO nanoparticles were found to be higher compared to the thin films because of the surface relaxation induced volume reductions in the nanometer scale. The photo-curable property of these polymer composite films is exploited to demonstrate fabrication of a micro-cantilever test structure.

  11. Template-controlled piezoactivity of ZnO thin films grown via a bioinspired approach

    PubMed Central

    Blumenstein, Nina J; Streb, Fabian; Walheim, Stefan; Schimmel, Thomas; Bill, Joachim

    2017-01-01

    Biomaterials are used as model systems for the deposition of functional inorganic materials under mild reaction conditions where organic templates direct the deposition process. In this study, this principle was adapted for the formation of piezoelectric ZnO thin films. The influence of two different organic templates (namely, a carboxylate-terminated self-assembled monolayer and a sulfonate-terminated polyelectrolyte multilayer) on the deposition and therefore on the piezoelectric performance was investigated. While the low negative charge of the COOH-SAM is not able to support oriented attachment of the particles, the strongly negatively charged sulfonated polyelectrolyte leads to texturing of the ZnO film. This texture enables a piezoelectric performance of the material which was measured by piezoresponse force microscopy. This study shows that it is possible to tune the piezoelectric properties of ZnO by applying templates with different functionalities. PMID:28243568

  12. Variable temperature photoluminescence of pulsed laser deposited ZnO thin films

    NASA Astrophysics Data System (ADS)

    Cui, J. B.; Soo, Y. C.; Thomas, A.; Kandel, H.; Chen, T. P.; Daghlian, C. P.

    2008-08-01

    Variable temperature photoluminescence of ZnO thin films deposited by a reactive laser ablation of metallic zinc was investigated. Free and bound exciton emissions are absent at cryogenic temperature, and the near band edge (NBE) emission is independent of measurement temperature for the ZnO thin film deposited at room temperature. Annealing at 700 °C results in the removal of defects, reappearance of exciton emission, and a temperature dependent NBE emission. The experimental data suggest that defects play an important role in the band edge emission in terms of both spectra shape and temperature dependence. Our observations will have an impact on device applications using ZnO, especially for optoelectronics that utilizes the exciton emission.

  13. High Performance and Highly Reliable ZnO Thin Film Transistor Fabricated by Atomic Layer Deposition for Next Generation Displays

    DTIC Science & Technology

    2011-08-19

    zinc oxide ( ZnO ) thin film as an active channel layer in TFT has become of great interest owing to their specific...630-0192 Japan Phone: +81-743-72-6060 Fax: +81-743-72-6069 E-mail: uraoka@ms.naist.jp Keywords: zinc oxide , thin film transistors , atomic layer...deposition Symposium topic: Transparent Semiconductors Oxides [Abstract] In this study, we fabricated TFTs using ZnO thin film as the

  14. Physical-mechanical and antimicrobial properties of nanocomposite films with pediocin and ZnO nanoparticles.

    PubMed

    Espitia, Paula Judith Perez; Soares, Nilda de Fátima Ferreira; Teófilo, Reinaldo F; Coimbra, Jane Sélia dos Reis; Vitor, Débora M; Batista, Rejane Andrade; Ferreira, Sukarno Olavo; de Andrade, Nélio José; Medeiros, Eber Antonio Alves

    2013-04-15

    This work aimed to develop nanocomposite films of methyl cellulose (MC) incorporated with pediocin and zinc oxide nanoparticles (nanoZnO) using the central composite design and response surface methodology. This study evaluated film physical-mechanical properties, including crystallography by X-ray diffraction, mechanical resistance, swelling and color properties, microscopy characterization, thermal stability, as well as antimicrobial activity against Staphylococcus aureus and Listeria monocytogenes. NanoZnO and pediocin affected the crystallinity of MC. Load at break and tensile strength at break did not differ among films. NanoZnO and pediocin significantly affected the elongation at break. Pediocin produced yellowish films, but nano ZnO balanced this effect, resulting in a whitish coloration. Nano ZnO exhibited good intercalation in MC and the addition of pediocin in high concentrations resulted crater-like pits in the film surfaces. Swelling of films diminished significantly compared to control. Higher concentrations of Nano ZnO resulted in enhanced thermal stability. Nanocomposite films presented antimicrobial activity against tested microorganisms.

  15. Nanomechanical and microstructural characterization of sputter deposited ZnO thin films

    NASA Astrophysics Data System (ADS)

    Bhardwaj, Vipul; Chowdhury, Rajib; Jayaganthan, R.

    2016-12-01

    The nano-mechanical properties of ZnO thin films deposited at different substrate temperature such as (RT) 25 °C, 100 °C, 200 °C, and 300 °C using DC-sputtering on Corning glass substrate were investigated. The ZnO thin films are found to be predominately c-axis (002) oriented. The crystal structure is sensitive to increasing substrate temperature and new set of crystal planes become visible at 300 °C as thin films become highly polycrystalline. The presence of (103) crystal plane is more pronounced with the increasing substrate temperature. However, high crystallinity and peak intensity ratio I(002)/I(103) (counts) is highest for thin films deposited at 100 °C, which is attributed for high hardness and better adhesive properties observed for ZnO thin films. Concomitantly, no major sudden burst of displacement 'pop-in' event in load-displacement curve of thin films observed during indentation, indicating the films are dense with low defects and adhered strongly to the substrate.

  16. Effects of high magnetic field assisted annealing on structure and optical, electric properties of electrodeposited ZnO films

    NASA Astrophysics Data System (ADS)

    Gao, Yang; Li, Guojian; Wu, Chun; Sui, Xudong; Du, Jiaojiao; Wang, Qiang

    2017-01-01

    Electrodeposited ZnO films have been annealed at 300 °C for 2 h under 12 T high magnetic field (HMF) with the directions of parallel and perpendicular to the films, respectively. The structural, optical and electric properties were characterized by scanning electron microscopy, X-ray diffraction, photoluminescence (PL) spectra, X-ray photoemission spectroscopy (XPS) and Seebeck coefficient/electrical resistance measuring system. The results show that HMF has a significant effect on the growth of ZnO films along c-axis and leads to hexagonal platelets of ZnO growing parallel to the direction of HMF. Furthermore, the hexagonal platelets become bulky platelets with an obvious trendy rotating their c-axis parallel to the substrate. The PL spectra of all the films exhibits the UV and blue emission, moreover, the blue emission plays the main role. The resistivity of ZnO films increases with the increase of measure temperature, which shows a typical degenerate semiconductor characteristic. HMF reduces significantly the intensity of whole emission peaks and the resistivity of ZnO films. These may be attribute to the significant changes of the structure and morphology of ZnO films, leading to various amounts of the defects in the ZnO crystal.

  17. Well-Aligned Arrays of Vertically Oriented ZnO Nanorod Films for Photocatalytic Degradation of Textile Dye

    NASA Astrophysics Data System (ADS)

    Nasr-Esfahani, Mojtaba; Nekoubin, Amin

    2011-05-01

    Well-aligned hexagonal ZnO nanorods arrays were synthesized via mild hydrothermal method under different conditions. A two-step approach was employed for the epitaxial growth of ZnO. First a ZnO seed layer was prepared by spin-coating process and then ZnO nanorods were deposited on it. The influences of growth time on the surface morphology, length, diameters and phase structure of ZnO rods films were investigated by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The photocatalytic degradation of X6G an anionic monoazo dye, in aqueous solutions, was investigated and the effects of hydrothermal process time were examined. The results showed that the ZnO nonorods film hydrothermal treated for 4 h have a very high photocatalytic performance.

  18. Modification of ZnO Thin Films by Ni, Cu, and Cd Doping*1

    NASA Astrophysics Data System (ADS)

    Jiménez-González, A. E.

    1997-02-01

    With the propose of investigating the effect of transition elements in ZnO thin films prepared by the Successive Ion Layer Adsorption and Reaction (SILAR) technique, the deposition solutions were chemically impurified with Ni, Cu, and Cd, as elements of the Ib, IIb, and VIIIa groups. X-ray fluorescence (XRF) analyses confirm that the impurification with Ni and Cu in fact took place but the impurification with Cd did not, while the XRD analyses show that foras preparedand Ni-impurified annealed films, the crystallites are almost oriented along thecaxis. The electrical properties of the ZnO films were also modified with the impurification. After annealing in air (450°C) the dark conductivity of the films was increased in the case of Ni and Cd impurification up to 1.80×10-3and 1.86×10-2[Ω cm]-1, respectively, but it decreased drastically in the case of Cu to 5.51×10-7[Ω cm]-1, as referred to the dark conductivity (1.86×10-4[Ω cm]-1) of the pure ZnO sample. The measured activation energy for the electrical conductivity of the modified ZnO thin films is 55 meV for the Ni modification, indicating the existence of donor levels. On the other hand, the Cu modification increases the activation energy up to 132 meV, which is higher than the activation energy for pure ZnO thin films (98 meV).

  19. Growth and characterization of nonpolar, heavily Mn-substituted ZnO films

    SciTech Connect

    Shao, Q.; Ku, P. S.; Wang, X. L.; Cheng, W. F.; Ruotolo, A.; Leung, C. W.

    2014-05-07

    Eight percent of Mn was successfully diluted into nonpolar ZnO films deposited by pulsed laser deposition on single crystal (100) SrTiO{sub 3} substrates. X-ray diffraction patterns and energy-dispersive X-ray spectroscopy confirmed high crystallinity of the films and excluded unintentional magnetic doping. A unique surface domain structure was observed by scanning electron microscope and atomic force microscope, which might play a vital role to strain release induced by lattice mismatch between nonpolar (11–20) ZnO film and (100) SrTiO{sub 3} substrate. In addition, the films showed strong ferromagnetism with a large coercivity H{sub C} ∼ 180 Oe at room temperature. The large magnetic moment is ascribed to carrier-mediated exchange interaction between the Mn ions, where the majority of the carriers are oxygen vacancies.

  20. ZnO nanoparticle-containing emulsions for transparent, hydrophobic UV-absorbent films.

    PubMed

    Tigges, Britta; Möller, Martin; Weichold, Oliver

    2010-05-01

    A simple method for the preparation of thin, zinc oxide nanoparticle-containing films showing high UV absorption, high transmittance in the visible range (>88%), and water repellence with contact angles of 120 degrees is presented. The films are coated from an emulsion containing the hydrophobic polymer and the nanoparticles. This emulsion was prepared by mixing commercial o/w emulsions used for hydrophobic coatings on textiles with ZnO nanoparticle-containing o/w emulsions. The latter were designed so that the mixed coating formulation could be prepared without breaking. Preparation and properties of the o/w emulsions as well as the final films are elaborated. The performance of hydrophobic and hydrophilic ZnO nanoparticles during preparation and in the final film is evaluated.

  1. Enhanced optical band-gap of ZnO thin films by sol-gel technique

    NASA Astrophysics Data System (ADS)

    Raghu, P.; Naveen, C. S.; Shailaja, J.; Mahesh, H. M.

    2016-05-01

    Transparent ZnO thin films were prepared using different molar concentration (0.1 M, 0.2 M & 0.8 M) of zinc acetate on soda lime glass substrates by the sol-gel spin coating technique. The optical properties revealed that the transmittance found to decrease with increase in molar concentration. Absorption edge showed that the higher concentration film has increasingly red shifted. An increased band gap energy of the thin films was found to be direct allowed transition of ˜3.9 eV exhibiting their relevance for photovoltaic applications. The extinction coefficient analysis revealed maximum transmittance with negligible absorption coefficient in the respective wavelengths. The results of ZnO thin film prepared by sol-gel technique reveal its suitability for optoelectronics and as a window layer in solar cell applications.

  2. A back-illuminated heterojunctions ultraviolet photodetector based on ZnO film

    NASA Astrophysics Data System (ADS)

    Jiang, Xiandong; Li, Dawei; Yang, Wenjun; Wang, Jiming; Lin, Xu; Huang, Ziqiang

    2010-10-01

    In this paper, we present the investigation of a back-illuminated heterojunctions ultraviolet detector, which were fabricated by depositing Ag-doped ZnO based (ZnO-TiO2) thin film on transparent conductive layer of ITO coated quartz substrate though the reactive radio-frequency (RF) magnetron sputtering at higher oxygen pressure. The p-n junction characteristic is confirmed by current-voltage (I-V) measurements. The turn-on voltage was 6 V, with a low leakage current under reverse bias (-5 V), corresponding values was just 0.2 nA . It is clearly showed the rectifying characteristics of typical p-n junction's rectifier behaviors. The structural, component and UV (365 nm, 1400 μW/cm2) photoresponse properties were explored by X-ray diffraction (XRD), Scanning Electron Microscope (SEM), X-ray energy dispersive spectrometer (EDS) and Tektronix oscilloscope. The results showed that: Ag in substitution form in the ZnO lattice, Ag doping concentration is low, the sample is highly c-axis preferred orientation, With the increase in doped Ag volume, ZnO film of 002 peaks no longer appear. The surface of the Ag doped ZnO based film exhibits a smooth surface and very dense structure, no visible pores and defects over the film were observed.The ultraviolet response time measurements showed rise and fall time are several seconds Level.

  3. Growth and optical characteristics of high-quality ZnO thin films on graphene layers

    SciTech Connect

    Park, Suk In; Tchoe, Youngbin; Baek, Hyeonjun; Hyun, Jerome K.; Yi, Gyu-Chul E-mail: gcyi@snu.ac.kr; Heo, Jaehyuk; Jo, Janghyun; Kim, Miyoung; Kim, Nam-Jung E-mail: gcyi@snu.ac.kr

    2015-01-01

    We report the growth of high-quality, smooth, and flat ZnO thin films on graphene layers and their photoluminescence (PL) characteristics. For the growth of high-quality ZnO thin films on graphene layers, ZnO nanowalls were grown using metal-organic vapor-phase epitaxy on oxygen-plasma treated graphene layers as an intermediate layer. PL measurements were conducted at low temperatures to examine strong near-band-edge emission peaks. The full-width-at-half-maximum value of the dominant PL emission peak was as narrow as 4 meV at T = 11 K, comparable to that of the best-quality films reported previously. Furthermore, the stimulated emission of ZnO thin films on the graphene layers was observed at the low excitation energy of 180 kW/cm{sup 2} at room temperature. Their structural and optical characteristics were investigated using X-ray diffraction, transmission electron microscopy, and PL spectroscopy.

  4. Hydrothermal Growth and Application of ZnO Nanowire Films with ZnO and TiO2 Buffer Layers in Dye-Sensitized Solar Cells

    NASA Astrophysics Data System (ADS)

    Yang, Weiguang; Wan, Farong; Chen, Siwei; Jiang, Chunhua

    2009-12-01

    This paper reports the effects of the seed layers prepared by spin-coating and dip-coating methods on the morphology and density of ZnO nanowire arrays, thus on the performance of ZnO nanowire-based dye-sensitized solar cells (DSSCs). The nanowire films with the thick ZnO buffer layer (~0.8-1 μm thick) can improve the open circuit voltage of the DSSCs through suppressing carrier recombination, however, and cause the decrease of dye loading absorbed on ZnO nanowires. In order to further investigate the effect of TiO2 buffer layer on the performance of ZnO nanowire-based DSSCs, compared with the ZnO nanowire-based DSSCs without a compact TiO2 buffer layer, the photovoltaic conversion efficiency and open circuit voltage of the ZnO DSSCs with the compact TiO2 layer (~50 nm thick) were improved by 3.9-12.5 and 2.4-41.7%, respectively. This can be attributed to the introduction of the compact TiO2 layer prepared by sputtering method, which effectively suppressed carrier recombination occurring across both the film-electrolyte interface and the substrate-electrolyte interface.

  5. Growth of crystalline ZnO films on the nitridated (0001) sapphire surface

    SciTech Connect

    Butashin, A. V.; Kanevsky, V. M.; Muslimov, A. E. Prosekov, P. A.; Kondratev, O. A.; Blagov, A. E.; Vasil’ev, A. L.; Rakova, E. V.; Babaev, V. A.; Ismailov, A. M.; Vovk, E. A.; Nizhankovsky, S. V.

    2015-07-15

    The surface morphology and structure of (0001) sapphire substrates subjected to thermochemical nitridation in a mixture of N{sub 2}, CO, and H{sub 2} gases are investigated by electron and probe microscopy and X-ray and electron diffraction. It is shown that an aluminum nitride layer is formed on the substrate surface and heteroepitaxial ZnO films deposited onto such substrates by magnetron sputtering have a higher quality when compared with films grown on sapphire.

  6. Study of deposition parameters for the fabrication of ZnO thin films using femtosecond laser

    NASA Astrophysics Data System (ADS)

    Hashmi, Jaweria Zartaj; Siraj, Khurram; Latif, Anwar; Murray, Mathew; Jose, Gin

    2016-08-01

    Femtosecond (fs) pulsed laser deposition (fs-PLD) of ZnO thin film on borosilicate glass substrates is reported in this work. The effect of important fs-PLD parameters such as target-substrate distance, laser pulse energy and substrate temperature on structure, morphology, optical transparency and luminescence of as-deposited films is discussed. XRD analysis reveals that all the films grown using the laser energy range 120-230 μJ are polycrystalline when they are deposited at room temperature in a ~10-5 Torr vacuum. Introducing 0.7 mTorr oxygen pressure, the films show preferred c-axis growth and transform into a single-crystal-like film when the substrate temperature is increased to 100 °C. The scanning electron micrographs show the presence of small nano-size grains at 25 °C, which grow in size to the regular hexagonal shape particles at 100 °C. Optical transmission of the ZnO film is found to increase with an increase in crystal quality. Maximum transmittance of 95 % in the wavelength range 400-1400 nm is achieved for films deposited at 100 °C employing a laser pulse energy of 180 μJ. The luminescence spectra show a strong UV emission band peaked at 377 nm close to the ZnO band gap. The shallow donor defects increase at higher pulse energies and higher substrate temperatures, which give rise to violet-blue luminescence. The results indicate that nano-crystalline ZnO thin films with high crystalline quality and optical transparency can be fabricated by using pulses from fs lasers.

  7. ZnO nanowire arrays synthesized on ZnO and GaN films for photovoltaic and light-emitting devices

    NASA Astrophysics Data System (ADS)

    Janfeshan, Bita; Sadeghimakki, Bahareh; Sadeghi Jahed, Navid Mohammad; Sivoththaman, Siva

    2014-01-01

    The wide bandgap, one-dimensional zinc oxide (ZnO) nanowires (NWs) and their heterostructures with other materials provide excellent pathways for efficient photovoltaic (PV) and light-emitting devices. ZnO NWs sensitized with quantum dots (QDs) provide high-surface area and tunable bandgap absorbers with a directional path for carriers in advanced PV devices, while ZnO heterojunctions with other p-type wide bandgap materials lead to light-emitting diodes (LEDs) with better emission and waveguiding properties compared with the homojunction counterparts. Synthesis of the structures with the desired morphology is a key to device applications. In this work, ZnO NW arrays were synthesized using hydrothermal method on ZnO and GaN thin films. Highly crystalline, upright, and ordered arrays of ZnO NWs in the 50 to 250-nm diameter range and 1 μm in length were obtained. The morphology and optical properties of the NWs were studied. Energy dispersive x-ray spectroscopy (EDX) analysis revealed nonstoichiometric oxygen content in the grown ZnO NWs. Photoluminescence (PL) studies depicted the presence of oxygen vacancy and interstitial zinc defects in the grown ZnO NWs, underlining the potential for LEDs. Further, hydrophobically ligated CdSe/ZnS QDs were successfully incorporated to the NW arrays. PL analysis indicated the injection of electrons from photoexcited QDs to the NWs, showing the potential for quantum dot-sensitized solar cells.

  8. Formation mechanisms of metallic Zn nanodots by using ZnO thin films deposited on n-Si substrates

    SciTech Connect

    Yuk, J. M.; Lee, J. Y.; Kim, Y.; No, Y. S.; Kim, T. W.; Choi, W. K.

    2010-08-09

    High-resolution transmission electron microscopy and energy dispersive x-ray spectroscopy results showed that metallic Zn nanodots (NDs) were fabricated through transformation of ZnO thin films by deposition of SiO{sub x} on ZnO/n-Si (100) heterostructures. The Zn NDs with various sizes and densities were formed due to the occurrence of the mass diffusion of atoms along the grain boundaries in the ZnO thin films. The fabrication mechanisms of metallic Zn NDs through transformation of ZnO thin films deposited on n-Si substrates are described on the basis of the experimental results.

  9. A comparison of ZnO films deposited on indium tin oxide and soda lime glass under identical conditions

    SciTech Connect

    Deka, Angshuman; Nanda, Karuna Kar

    2013-06-15

    ZnO films have been grown via a vapour phase transport (VPT) on soda lime glass (SLG) and indium-tin oxide (ITO) coated glass. ZnO film on ITO had traces of Zn and C which gives them a dark appearance while that appears yellowish-white on SLG. X-ray photoelectron spectroscopy studies confirm the traces of C in the form of C-O. The photoluminescence studies reveal a prominent green luminescence band for ZnO film on ITO.

  10. The properties of plasma-enhanced atomic layer deposition (ALD) ZnO thin films and comparison with thermal ALD

    NASA Astrophysics Data System (ADS)

    Kim, Doyoung; Kang, Hyemin; Kim, Jae-Min; Kim, Hyungjun

    2011-02-01

    Zinc oxide (ZnO) thin films were prepared by plasma-enhanced atomic layer deposition (PE-ALD) using oxygen plasma as a reactant and the properties were compared with those of thermal atomic layer deposition (TH-ALD) ZnO thin films. While hexagonal wurzite phase with preferential (0 0 2) orientation was obtained for both cases, significant differences were observed in various aspects of film properties including resistivity values between these two techniques. Photoluminescence (PL) measurements have shown that high resistivity of PE-ALD ZnO thin films is due to the oxygen interstitials at low growth temperature of 200 °C, whose amount decreases with increasing growth temperature. Thin film transistors (TFT) using TH- and PE-ALD ZnO as an active layer were also fabricated and the device properties were evaluated comparatively.

  11. Ferromagnetic behaviour of Fe-doped ZnO nanograined films.

    PubMed

    Straumal, Boris B; Protasova, Svetlana G; Mazilkin, Andrei A; Tietze, Thomas; Goering, Eberhard; Schütz, Gisela; Straumal, Petr B; Baretzky, Brigitte

    2013-01-01

    The influence of the grain boundary (GB) specific area s GB on the appearance of ferromagnetism in Fe-doped ZnO has been analysed. A review of numerous research contributions from the literature on the origin of the ferromagnetic behaviour of Fe-doped ZnO is given. An empirical correlation has been found that the value of the specific grain boundary area s GB is the main factor controlling such behaviour. The Fe-doped ZnO becomes ferromagnetic only if it contains enough GBs, i.e., if s GB is higher than a certain threshold value s th = 5 × 10(4) m(2)/m(3). It corresponds to the effective grain size of about 40 μm assuming a full, dense material and equiaxial grains. Magnetic properties of ZnO dense nanograined thin films doped with iron (0 to 40 atom %) have been investigated. The films were deposited by using the wet chemistry "liquid ceramics" method. The samples demonstrate ferromagnetic behaviour with J s up to 0.10 emu/g (0.025 μB/f.u.ZnO) and coercivity H c ≈ 0.03 T. Saturation magnetisation depends nonmonotonically on the Fe concentration. The dependence on Fe content can be explained by the changes in the structure and contiguity of a ferromagnetic "grain boundary foam" responsible for the magnetic properties of pure and doped ZnO.

  12. Ferromagnetic behaviour of Fe-doped ZnO nanograined films

    PubMed Central

    Protasova, Svetlana G; Mazilkin, Andrei A; Tietze, Thomas; Goering, Eberhard; Schütz, Gisela; Straumal, Petr B; Baretzky, Brigitte

    2013-01-01

    Summary The influence of the grain boundary (GB) specific area s GB on the appearance of ferromagnetism in Fe-doped ZnO has been analysed. A review of numerous research contributions from the literature on the origin of the ferromagnetic behaviour of Fe-doped ZnO is given. An empirical correlation has been found that the value of the specific grain boundary area s GB is the main factor controlling such behaviour. The Fe-doped ZnO becomes ferromagnetic only if it contains enough GBs, i.e., if s GB is higher than a certain threshold value s th = 5 × 104 m2/m3. It corresponds to the effective grain size of about 40 μm assuming a full, dense material and equiaxial grains. Magnetic properties of ZnO dense nanograined thin films doped with iron (0 to 40 atom %) have been investigated. The films were deposited by using the wet chemistry “liquid ceramics” method. The samples demonstrate ferromagnetic behaviour with J s up to 0.10 emu/g (0.025 μB/f.u.ZnO) and coercivity H c ≈ 0.03 T. Saturation magnetisation depends nonmonotonically on the Fe concentration. The dependence on Fe content can be explained by the changes in the structure and contiguity of a ferromagnetic “grain boundary foam” responsible for the magnetic properties of pure and doped ZnO. PMID:23844341

  13. Fabrication and characterization of pristine and annealed Ga doped ZnO thin films using sputtering

    NASA Astrophysics Data System (ADS)

    Mishra, Abhisek; Mohapatra, Saswat; Gouda, Himanshu Sekhar; Singh, Udai P.

    2016-05-01

    ZnO is a wide-band gap, transparent, polar semiconductor with unparalleled optoelectronic, piezoelectric, thermal and transport properties, which make it the material of choice for a wide range of applications such as blue/UV optoelectronics, energy conversion, transparent electronics, spintronic, plasmonic and sensor devices. We report, three sets of Ga doped Zinc Oxide (GZO) were fabricated in different sputtering power (100 watt, 200 watt and 300 watt). Thereafter films were annealed in nitrogen ambient for 30 minutes at 400° C. From the optical absorption spectroscopy it was found that pristine films are showing a 75% transmittance in the visible region of light and it increases after the annealing. However, for 300 W grown sample opposite trend has been achieved for the post annealed sample. X-ray diffraction pattern of all the pristine and annealed films showed a preferable growth orientation at (002) phase. Some other weak peaks were also appeared in different angle which indicates that films are polycrystalline in nature. XRD data also reveals that crystallite size increases with sputtering power up to 200 W and thereafter it decreases with the deposition power. It also noted that the crystallite size of the annealed film increases with compare to the non annealed films. At room temperature an enhancement in electrical properties of Ga doped ZnO thin films was noted for the annealed ZnO films except for the film deposited at 300 watt. More significantly, it was found that annealed thin films showed the resistivity in the range of 10-3 ˜ 10-4 ohm-cm. Such a high optical transmittance and conducting zinc-oxide thin film can be used as a window layer in solar cell.

  14. Decrease in work function of boron ion-implanted ZnO thin films.

    PubMed

    Heo, Gi-Seok; Hong, Sang-Jin; Park, Jong-Woon; Choi, Bum-Ho; Lee, Jong-Ho; Shin, Dong-Chan

    2007-11-01

    We have fabricated boron ion-implanted ZnO thin films by ion implantation into sputtered ZnO thin films on a glass substrate. An investigation of the effects of ion doses and activation time on the electrical and optical properties of the films has been made. The electrical sheet resistance and resistivity of the implanted films are observed to increase with increasing rapid thermal annealing (RTA) time, while decreasing as the ion dose increases. Without any RTA process, the variation of the carrier density is insensitive to the ion dose. With the RTA process, however, the carrier density of the implanted films increases and approaches that of the un-implanted ZnO film as the ion dose increases. On the other hand, the carrier mobility is shown to decrease with increasing ion doses when no RTA process is applied. With the RTA process, however, there is almost no change in the mobility. We have achieved the optical transmittance as high as 87% within the visible wavelength range up to 800 nm. It is also demonstrated that the work function can be engineered by changing the ion dose during the ion implantation process. We have found that the work function decreases as the ion dose increases.

  15. Effect of Oxidation Condition on Growth of N: ZnO Prepared by Oxidizing Sputtering Zn-N Film.

    PubMed

    Qin, Xuesi; Li, Guojian; Xiao, Lin; Chen, Guozhen; Wang, Kai; Wang, Qiang

    2016-12-01

    Nitrogen-doped zinc oxide (N: ZnO) films have been prepared by oxidizing reactive RF magnetron-sputtering zinc nitride (Zn-N) films. The effect of oxidation temperature and oxidation time on the growth, transmittance, and electrical properties of the film has been explored. The results show that both long oxidation time and high oxidation temperature can obtain the film with a good transmittance (over 80 % for visible and infrared light) and a high carrier concentration. The N: ZnO film exhibits a special growth model with the oxidation time and is first to form a N: ZnO particle on the surface, then to become a N: ZnO layer, and followed by the inside Zn-N segregating to the surface to oxidize N: ZnO. The surface particle oxidized more adequately than the inside. However, the X-ray photoemission spectroscopy results show that the lower N concentration results in the lower N substitution in the O lattice (No). This leads to the formation of n-type N: ZnO and the decrease of carrier concentration. Thus, this method can be used to tune the microstructure, optical transmittance, and electrical properties of the N: ZnO film.

  16. Effects of a seed layer on the structural properties of RF-sputtered ZnO thin films

    NASA Astrophysics Data System (ADS)

    Ur, Soon-Chul; Yi, Seung-Hwan

    2016-01-01

    Radio-frequency (RF) sputtered deposition combined with sol-gel spin coating has been applied to achieve a high-quality, c-axis-oriented ZnO film. The deposited ZnO films show only a c-axis-oriented ZnO (002) peak. The morphology, structure, and residual stress of the deposited ZnO films are found to depend strongly on the concentration of the precursor. As the concentration of the precursor is increased from 0.1-M to 0.6-M, the residual stress of the ZnO films changes from a compressive (-415 MPa) to a mild tensile (+90 MPa) mode. The deposited ZnO film interestingly shows facets when the concentration of the precursor is 0.6-M. We suggest that the residual stress in sputter-deposited ZnO films can be controlled by using the precursor concentration. This technique is believed to have been used for the first time, and can be applied to control the uniformity during micro speaker fabrication.

  17. Improvement of Flame-made ZnO Nanoparticulate Thick Film Morphology for Ethanol Sensing

    PubMed Central

    Liewhiran, Chaikarn; Phanichphantandast, Sukon

    2007-01-01

    ZnO nanoparticles were produced by flame spray pyrolysis using zinc naphthenate as a precursor dissolved in toluene/acetonitrile (80/20 vol%). The particles properties were analyzed by XRD, BET. The ZnO particle size and morphology was observed by SEM and HR-TEM revealing spheroidal, hexagonal, and rod-like morphologies. The crystallite sizes of ZnO spheroidal and hexagonal particles ranged from 10-20 nm. ZnO nanorods were ranged from 10-20 nm in width and 20-50 nm in length. Sensing films were produced by mixing the nanoparticles into an organic paste composed of terpineol and ethyl cellulose as a vehicle binder. The paste was doctor-bladed onto Al2O3 substrates interdigitated with Au electrodes. The morphology of the sensing films was analyzed by optical microscopy and SEM analysis. Cracking of the sensing films during annealing process was improved by varying the heating conditions. The gas sensing of ethanol (25-250 ppm) was studied at 400 °C in dry air containing SiC as the fluidized particles. The oxidation of ethanol on the surface of the semiconductor was confirmed by mass spectroscopy (MS). The effect of micro-cracks was quantitatively accounted for as a provider of extra exposed edges. The sensitivity decreased notably with increasing crack of sensing films. It can be observed that crack widths were reduced with decreasing heating rates. Crack-free of thick (5 μm) ZnO films evidently showed higher sensor signal and faster response times (within seconds) than cracked sensor. The sensor signal increased and the response time decreased with increasing ethanol concentration.

  18. Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films

    NASA Astrophysics Data System (ADS)

    Thapa, Dinesh; Huso, Jesse; Morrison, John L.; Corolewski, Caleb D.; McCluskey, Matthew D.; Bergman, Leah

    2016-08-01

    ZnO is an efficient luminescent material in the UV-range ∼3.4 eV with a wide range of applications in optical technologies. Sputtering is a cost-effective and relatively straightforward growth technique for ZnO films; however, most as-grown films are observed to contain intrinsic defects which can significantly diminish the desirable UV-emission. In this research the defect dynamics and optical properties of ZnO sputtered films were studied via post-growth annealing in Ar or O2 ambient, with X-ray diffraction (XRD), imaging, transmission and Urbach analysis, Raman scattering, and photoluminescence (PL). The imaging, XRD, Raman and Urbach analyses indicate significant improvement in crystal morphology and band-edge characteristics upon annealing, which is nearly independent of the annealing environment. The native defects specific to the as-grown films, which were analyzed via PL, are assigned to Zni related centers that luminesce at 2.8 eV. Their presence is attributed to the nature of the sputtering growth technique, which supports Zn-rich growth conditions. After annealing, in either environment the 2.8 eV center diminished accompanied by morphology improvement, and the desirable UV-PL significantly increased. The O2 ambient was found to introduce nominal Oi centers while the Ar ambient was found to be the ideal environment for the enhancement of the UV-light emission: an enhancement of ∼40 times was achieved. The increase in the UV-PL is attributed to the reduction of Zni-related defects, the presence of which in ZnO provides a competing route to the UV emission. Also, the effect of the annealing was to decrease the compressive stress in the films. Finally, the dominant UV-PL at the cold temperature regime is attributed to luminescent centers not associated with the usual excitons of ZnO, but rather to structural defects.

  19. Electrochemical Synthesis of Highly Oriented, Transparent, and Pinhole-Free ZnO and Al-Doped ZnO Films and Their Use in Heterojunction Solar Cells.

    PubMed

    Kang, Donghyeon; Lee, Dongho; Choi, Kyoung-Shin

    2016-10-04

    Electrochemical synthesis conditions using nonaqueous solutions were developed to prepare highly transparent (T > 90%) and crystalline ZnO and Al-doped ZnO (AZO) films for use in solar energy conversion devices. A focused effort was made to produce pinhole-free films in a reproducible manner by identifying a key condition to prevent the formation of cracks during deposition. The polycrystalline domains in the resulting films had a uniform orientation (i.e., the c-axis perpendicular to the substrate), which enhanced the electron transport properties of the films. Furthermore, electrochemical Al doping of ZnO using nonaqueous media, which was demonstrated for the first time in this study, effectively increased the carrier density and raised the Fermi level of ZnO. These films were coupled with an electrodeposited p-type Cu2O to construct p-n heterojunction solar cells to demonstrate the utilization of these films for solar energy conversion. The resulting n-ZnO/p-Cu2O and n-AZO/p-Cu2O cells showed excellent performance compared with previously reported n-ZnO/p-Cu2O cells prepared by electrodeposition. In particular, replacing ZnO with AZO resulted in simultaneous enhancements in short circuit current and open circuit potential, and the n-AZO/p-Cu2O cell achieved an average power conversion efficiency (η) of 0.92 ± 0.09%. The electrodeposition condition reported here will offer a practical and versatile way to produce ZnO or AZO films, which play key roles in various solar energy conversion devices, with qualities comparable to those prepared by vacuum-based techniques.

  20. Physical properties of fish gelatin-based bio-nanocomposite films incorporated with ZnO nanorods.

    PubMed

    Rouhi, Jalal; Mahmud, Shahrom; Naderi, Nima; Ooi, Ch Raymond; Mahmood, Mohamad Rusop

    2013-08-27

    Well-dispersed fish gelatin-based nanocomposites were prepared by adding ZnO nanorods (NRs) as fillers to aqueous gelatin. The effects of ZnO NR fillers on the mechanical, optical, and electrical properties of fish gelatin bio-nanocomposite films were investigated. Results showed an increase in Young's modulus and tensile strength of 42% and 25% for nanocomposites incorporated with 5% ZnO NRs, respectively, compared with unfilled gelatin-based films. UV transmission decreased to zero with the addition of a small amount of ZnO NRs in the biopolymer matrix. X-ray diffraction showed an increase in the intensity of the crystal facets of (10ī1) and (0002) with the addition of ZnO NRs in the biocomposite matrix. The surface topography of the fish gelatin films indicated an increase in surface roughness with increasing ZnO NR concentrations. The conductivity of the films also significantly increased with the addition of ZnO NRs. These results indicated that bio-nanocomposites based on ZnO NRs had great potentials for applications in packaging technology, food preservation, and UV-shielding systems.

  1. Physical properties of fish gelatin-based bio-nanocomposite films incorporated with ZnO nanorods

    PubMed Central

    2013-01-01

    Well-dispersed fish gelatin-based nanocomposites were prepared by adding ZnO nanorods (NRs) as fillers to aqueous gelatin. The effects of ZnO NR fillers on the mechanical, optical, and electrical properties of fish gelatin bio-nanocomposite films were investigated. Results showed an increase in Young's modulus and tensile strength of 42% and 25% for nanocomposites incorporated with 5% ZnO NRs, respectively, compared with unfilled gelatin-based films. UV transmission decreased to zero with the addition of a small amount of ZnO NRs in the biopolymer matrix. X-ray diffraction showed an increase in the intensity of the crystal facets of (10ī1) and (0002) with the addition of ZnO NRs in the biocomposite matrix. The surface topography of the fish gelatin films indicated an increase in surface roughness with increasing ZnO NR concentrations. The conductivity of the films also significantly increased with the addition of ZnO NRs. These results indicated that bio-nanocomposites based on ZnO NRs had great potentials for applications in packaging technology, food preservation, and UV-shielding systems. PMID:23981366

  2. Controllable growth and characterization of highly aligned ZnO nanocolumnar thin films

    NASA Astrophysics Data System (ADS)

    Onuk, Zuhal; Rujisamphan, Nopporn; Murray, Roy; Bah, Mohamed; Tomakin, Murat; Shah, S. Ismat

    2017-02-01

    We investigated the effects of growth conditions during magnetron sputtering on the structural, morphological, and optical properties of nanostructured ZnO thin films. Undoped ZnO thin films are deposited onto p-type Si (100) and corning 7059 glass substrates by RF magnetron sputtering using a ZnO target in combination with various Ar-O2 sputtering gas mixtures at room temperature. The effect of the partial pressure of oxygen on the morphology of ZnO thin film structure and band alignment were investigated. Thickness, and therefore the growth rate of the samples measured from the cross-sectional SEM micrographs, is found to be strongly correlated with the oxygen partial pressure in the sputtering chamber. The optical transmittance spectrometry results show that the absorption edge shifts towards the longer wavelength at higher oxygen partial pressure. X-ray photoelectron spectroscopy (XPS) used for determining the surface chemical structure and valence band offsets show that conduction band can be controlled by changing the sputtering atmosphere.

  3. Residual and intentional n-type doping of ZnO thin films grown by metal-organic vapor phase epitaxy on sapphire and ZnO substrates

    NASA Astrophysics Data System (ADS)

    Brochen, Stéphane; Lafossas, Matthieu; Robin, Ivan-Christophe; Ferret, Pierre; Gemain, Frédérique; Pernot, Julien; Feuillet, Guy

    2014-03-01

    ZnO epilayers usually exhibit high n-type residual doping which is one of the reasons behind the difficulties to dope this material p-type. In this work, we aimed at determining the nature of the involved impurities and their potential role as dopant in ZnO thin films grown by metalorganic vapor phase epitaxy (MOVPE) on sapphire and ZnO substrates. In both cases, secondary ion mass spectroscopy (SIMS) measurements give evidence for a strong diffusion of impurities from the substrate to the epilayer, especially for silicon and aluminum. In the case of samples grown on sapphire substrates, aluminum follows Fick's diffusion law on a wide growth temperature range (800-1000°C). Thus, the saturation solubility and the diffusion coefficient of aluminum in ZnO single crystals have been determined. Furthermore, the comparison between SIMS impurity and effective dopant concentrations determined by capacitance-voltage measurements highlights, on one hand a substitutional mechanism for aluminum diffusion, and on the other hand that silicon acts as a donor in ZnO and not as an amphoteric impurity. In addition, photoluminescence spectra exhibit excitonic recombinations at the same energy for aluminum and silicon, indicating that silicon behaves as an hydrogenic donor in ZnO. Based on these experimental observations, ZnO thin films with a controlled n-type doping in the 1016-1019cm-3 range have been carried out. These results show that MOVPE growth is fully compatible with the achievement of highly Al-doped n-type thin films, but also with the growth of materials with low residual doping, which is a crucial parameter to address ZnO p-type doping issues.

  4. CMOS Alcohol Sensor Employing ZnO Nanowire Sensing Films

    NASA Astrophysics Data System (ADS)

    Santra, S.; Ali, S. Z.; Guha, P. K.; Hiralal, P.; Unalan, H. E.; Dalal, S. H.; Covington, J. A.; Milne, W. I.; Gardner, J. W.; Udrea, F.

    2009-05-01

    This paper reports on the utilization of zinc oxide nanowires (ZnO NWs) on a silicon on insulator (SOI) CMOS micro-hotplate for use as an alcohol sensor. The device was designed in Cadence and fabricated in a 1.0 μm SOI CMOS process at XFAB (Germany). The basic resistive gas sensor comprises of a metal micro-heater (made of aluminum) embedded in an ultra-thin membrane. Gold plated aluminum electrodes, formed of the top metal, are used for contacting with the sensing material. This design allows high operating temperatures with low power consumption. The membrane was formed by using deep reactive ion etching. ZnO NWs were grown on SOI CMOS substrates by a simple and low-cost hydrothermal method. A few nanometer of ZnO seed layer was first sputtered on the chips, using a metal mask, and then the chips were dipped in a zinc nitrate hexahydrate and hexamethylenetramine solution at 90° C to grow ZnO NWs. The chemical sensitivity of the on-chip NWs were studied in the presence of ethanol (C2H5OH) vapour (with 10% relative humidity) at two different temperatures: 200 and 250° C (the corresponding power consumptions are only 18 and 22 mW). The concentrations of ethanol vapour were varied from 175-1484 ppm (pers per million) and the maximum response was observed 40% (change in resistance in %) at 786 ppm at 250° C. These preliminary measurements showed that the on-chip deposited ZnO NWs could be a promising material for a CMOS based ethanol sensor.

  5. The formation of anomalous Hall effect depending on W atoms in ZnO thin films

    NASA Astrophysics Data System (ADS)

    Can, Musa Mutlu; Shah, S. Ismat; Fırat, Tezer

    2014-06-01

    This article investigates the effects of intrinsic point defects and extrinsic W atoms on magneto electrical properties in the ZnO lattice. The analyses were accomplished for ∼0.5% W including ZnO thin films, grown using a radio frequency (RF) magnetron sputtering system. The polarized spin current dependent magnetic formation was investigated by longitudinal and transverse magneto electrical measurements in a temperature range of 5 K to 300 K. The positive magneto resistivity (PMR) ratios reached 28.8%, 12.7%, and 17.6% at 5 K for thin films, having different post-deposition annealing conditions as a consequence of ionic W dependent defects in the lattice. Furthermore, an anomalous Hall effect, originating from polarized spin currents, was understood from the split in Hall resistance versus magnetic field (Rxy(H)) curves for the thin film with high amount of Zn2+ and W6+ ionic defects.

  6. Properties of boron-doped ZnO thin films grown by using MOCVD

    NASA Astrophysics Data System (ADS)

    Choi, In-Hwan

    2013-11-01

    Boron-doped ZnO thin films were prepared by using metal organic chemical-vapor deposition (MOCVD) with diethyl zinc and water as precursors and B2H6 as the dopant gas. The effects of the flow rates of H2O and B2H6 on the growth and the electrical properties of boron-doped ZnO thin film were investigated. The maximum carrier concentration and mobility and the minimum resistivity obtained under these experimental conditions were 7 × 1020 /cm3, 42 cm2 /V·sec and 4 × 10-4 Ω·cm, respectively, at room temperature. The electrical properties, growth rates, transmittances, and surface morphologies of the ZnO:B films grown using MOCVD are strongly affected by growth conditions such as the relative flow rates of the precursors and dopant gases and the chamber pressure, and these effects are discussed in detail in this article.

  7. Interplay between chemical state, electric properties, and ferromagnetism in Fe-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Chen, G.; Peng, J. J.; Song, C.; Zeng, F.; Pan, F.

    2013-03-01

    Valence state of Fe ions plays an important role in the physical properties of Fe doped ZnO films. Here, a series of Zn1-xFexO films with different Fe concentrations (x = 0, 2.3, 5.4, 7.1, and 9.3 at. %) were prepared to investigate their structural, piezoelectric, ferroelectric, bipolar resistive switching properties, and electrical-control of ferromagnetism at room temperature. The structure characterizations indicate that the chemical state of Fe ions substituting Zn2+ site changes from Fe3+ to Fe2+ with the increase of Fe dopant concentration. We found enhanced piezoelectric and ferroelectric properties in Zn0.977Fe0.023O films with more Fe3+ due to the smaller Fe3+ ionic size in comparison with Zn2+ while the increase of Fe2+ concentration by a larger amount of Fe dopant results in the worse ferroelectric and piezoelectric performance. All Pt/Zn1-xFexO/Pt devices show bipolar resistive switching properties. Especially, devices with lower Fe dopant concentration exhibit better endurance properties due to their higher crystalline quality. The variation of oxygen vacancies during resistive switching provides an opportunity to tune ferromagnetism of Fe-doped ZnO films, giving rise to the integration of charge and spin into a simple Pt/Zn1-xFexO/Pt devices. The multifunctional properties of Fe-doped ZnO films are promising for communication systems and information storage devices.

  8. Preparation and characterization of ALD deposited ZnO thin films studied for gas sensors

    NASA Astrophysics Data System (ADS)

    Boyadjiev, S. I.; Georgieva, V.; Yordanov, R.; Raicheva, Z.; Szilágyi, I. M.

    2016-11-01

    Applying atomic layer deposition (ALD), very thin zinc oxide (ZnO) films were deposited on quartz resonators, and their gas sensing properties were studied using the quartz crystal microbalance (QCM) method. The gas sensing of the ZnO films to NO2 was tested in the concentration interval between 10 and 5000 ppm. On the basis of registered frequency change of the QCM, for each concentration the sorbed mass was calculated. Further characterization of the films was carried out by various techniques, i.e. by SEM-EDS, XRD, ellipsometry, and FTIR spectroscopy. Although being very thin, the films were gas sensitive to NO2 already at room temperature and could register very well as low concentrations as 100 ppm, while the sorption was fully reversible. Our results for very thin ALD ZnO films show that the described fast, simple and cost-effective technology could be implemented for producing gas sensors working at room temperature and being capable to detect in real time low concentrations of NO2.

  9. Electron transport in Al-Cu co-doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Serin, T.; Atilgan, A.; Kara, I.; Yildiz, A.

    2017-03-01

    To investigate the influence of varying Al content on structural, optical, and electrical properties of ZnO thin films, Al-Cu co-doped ZnO thin films with fixed Cu content at 1 wt. % and different Al contents (1, 3, and 5 wt. %) were successfully synthesized on glass substrates using a sol-gel process. The results indicated that the varying Al content affects not only the grain size and band gap but also the electrical conductivity of the films, and a linear relationship was found between the band gap and strain values of the films. The temperature-dependent electrical conductivity data of the films demonstrated that electron transport was mainly controlled by the grain boundaries at intermediate and high temperatures, whereas it was governed by Mott-variable range hopping at low temperatures. Additionally, 3 wt. % Al content improved the electrical conductivity of Al-Cu co-doped ZnO by lowering the trap density and enhancing the hopping probability.

  10. ZnO and MgZnO Nanocrystalline Flexible Films: Optical and Material Properties

    DOE PAGES

    Huso, Jesse; Morrison, John L.; Che, Hui; ...

    2011-01-01

    An emore » merging material for flexible UV applications is Mg x Zn 1 − x O which is capable of tunable bandgap and luminescence in the UV range of ~3.4 eV–7.4 eV depending on the composition x . Studies on the optical and material characteristics of ZnO and Mg 0.3 Zn 0.7 O nanocrystalline flexible films are presented. The analysis indicates that the ZnO and Mg 0.3 Zn 0.7 O have bandgaps of 3.34 eV and 4.02 eV, respectively. The photoluminescence (PL) of the ZnO film was found to exhibit a structural defect-related emission at ~3.316 eV inherent to the nanocrystalline morphology. The PL of the Mg 0.3 Zn 0.7 O film exhibits two broad peaks at 3.38 eV and at 3.95 eV that are discussed in terms of the solubility limit of the ZnO-MgO alloy system. Additionally, external deformation of the film did not have a significant impact on its properties as indicated by the Raman LO-mode behavior, making these films attractive for UV flexible applications.« less

  11. Enhanced photoelectrochemical and optical performance of ZnO films tuned by Cr doping

    NASA Astrophysics Data System (ADS)

    Salem, M.; Akir, S.; Massoudi, I.; Litaiem, Y.; Gaidi, M.; Khirouni, K.

    2017-04-01

    In this paper, pure and Cr-doped nanostructured Zinc oxide thin films were synthesized by simple and low cost co-precipitation and spin-coating method with Cr concentration varying between 0.5 and 5 at.%. Crystalline structure of the prepared films was investigated by X-ray diffraction (XRD) and Raman spectroscopy techniques. XRD analysis indicated that the films were indexed as the hexagonal phase of wurtzite-type structure and demonstrated a decrease in the crystallite size with increasing Cr doping content. Cr doping revealed a significant effect on the optical measurements such as transmission and photoluminescence properties. The optical measurements indicated that Cr doping decreases the optical band gap and it has been shifted from 3.41 eV for pure ZnO film to 3.31 eV for 5 at.% Cr-doped one. The photoelectrochemical (PEC) sensing characteristics of Cr-doped ZnO layers were investigated. Amongst all photo-anodes with different Cr dopant concentration, the 2 at.% Cr incorporated ZnO films exhibited fast response and higher photoconduction sensitivity.

  12. Effect of aluminium doping on structural and optical properties of ZnO thin films by sol-gel method

    SciTech Connect

    Vijayaprasath, G.; Murugan, R.; Ravi, G. E-mail: gravicrc@gmail.com; Hayakawa, Y.

    2015-06-24

    We systematically investigated the structural, morphological and optical properties of 0.05 mol % Al doped ZnO (Al:ZnO) thin films deposited on glass substrates by sol-gel spin coating method. The influences of Al doping in ZnO thin films are characterized by Powder X-ray diffraction study. ZnO and Al:ZnO thin films have showed hexagonal wurtzite structure without any secondary phase in c-axis (002) orientation. The SEM images also proved the hexagonal rod like morphologies for both films. All the films exhibited transmittance of 70-80% in the visible range up to 800 nm and cut-off wavelength observed at ∼390 nm corresponding to the fundamental absorption of ZnO. The band gap of the ZnO thin films slightly widened with the Al doping. The photoluminescence properties have been studied for Al: ZnO thin films and the results are presented in detail.

  13. Improvement in LPG sensing response by surface activation of ZnO thick films with Cr2O3

    NASA Astrophysics Data System (ADS)

    Hastir, Anita; Virpal, Kaur, Jasmeet; Singh, Gurpreet; Kohli, Nipin; Singh, Onkar; Singh, Ravi Chand

    2015-05-01

    Liquefied Petroleum Gas (LPG) sensing response of pure and Cr2O3 activated ZnO has been investigated in this study. Zinc oxide was synthesized by co-precipitation route and deposited as a thick film on an alumina substrate. The surface of ZnO sensor was activated by chromium oxide on surface oxidation by chromium chloride. The concentration of chromium chloride solution used to activate the ZnO sensor surface has been varied from 0 to 5 %. It is observed that response to LPG has improved as compared to pure ZnO.

  14. The effect of heat treatment on the physical properties of sol-gel derived ZnO thin films

    NASA Astrophysics Data System (ADS)

    Raoufi, Davood; Raoufi, Taha

    2009-03-01

    Zinc oxide (ZnO) thin films were deposited on microscope glass substrates by sol-gel spin coating method. Zinc acetate (ZnAc) dehydrate was used as the starting salt material source. A homogeneous and stable solution was prepared by dissolving ZnAc in the solution of monoethanolamine (MEA). ZnO thin films were obtained after preheating the spin coated thin films at 250 °C for 5 min after each coating. The films, after the deposition of the eighth layer, were annealed in air at temperatures of 300 °C, 400 °C and 500 °C for 1 h. The effect of thermal annealing in air on the physical properties of the sol-gel derived ZnO thin films are studied. The powder and its thin film were characterized by X-ray diffractometer (XRD) method. XRD analysis revealed that the annealed ZnO thin films consist of single phase ZnO with wurtzite structure (JCPDS 36-1451) and show the c-axis grain orientation. Increasing annealing temperature increased the c-axis orientation and the crystallite size of the film. The annealed films are highly transparent with average transmission exceeding 80% in the visible range (400-700 nm). The measured optical band gap values of the ZnO thin films were between 3.26 eV and 3.28 eV, which were in the range of band gap values of intrinsic ZnO (3.2-3.3 eV). SEM analysis of annealed thin films has shown a completely different surface morphology behavior.

  15. [Stimulated emission characteristics of ZnO thin films deposited by magnetron sputtering on SiO2 substrates].

    PubMed

    Jing, Wang; Xi-qing, Zhang; Xiao-ying, Teng; De-ping, Xiong; Peng, Lin; Li, Wang; Shi-hua, Huang

    2004-07-01

    ZnO thin films were deposited by magnetron sputtering on SiQ2 substrates. The temperature dependence of the absorption spectra and the photoluminescence spectra was studied for ZnO thin film. The absorption of the longitudinal optical (LO) phonons and the free-excitons was observed at room temperature. The free-exciton emission was only observed in PL spectra at room temperature, the results indicate that ZnO thin films have excellent quality and low density of defects. The stimulated emission properties of ZnO thin films were investigated. When excitation intensity is above threshold, the FWHM o f stimulated emission peak increases and stimulated emission peak shows red shift with increasing excitation intensity. Our analysis shows that the optical gain is due to electronhole plasma emission.

  16. Influence of growth temperature of TiO 2 buffer on structure and PL properties of ZnO films

    NASA Astrophysics Data System (ADS)

    Zhang, Weiying; Zhao, Jianguo; Liu, Zhenzhong; Liu, Zhaojun; Fu, Zhuxi

    2010-05-01

    A series of ZnO films with TiO 2 buffer on Si (1 0 0) substrates were prepared by DC reactive sputtering. Growth temperature of TiO 2 buffer changed from 100 °C to 400 °C, and the influence on the crystal structures and optical properties of ZnO films have been investigated. The XRD results show that the ZnO films with TiO 2 buffer have a hexagonal wurtzite structure with random orientation, and with the increase of growth temperature of TiO 2 buffer, the residual stresses were released gradually. Specially, the UV emission enhanced distinctly and FWHMs (full width half maximum) decreased linearly with the increasing TiO 2 growth temperature. The results all come from the improvement of crystal quality of ZnO films.

  17. Electrical characteristics of ZnO nanorods reinforced polymer nanocomposite thin films

    SciTech Connect

    Bhattacharjee, Snigdha; Roy, Asim

    2015-05-15

    ZnO nanorods have been prepared by simple chemical method, which is used to fabricate organic bistable devices (OBDs). OBDs are fabricated by incorporating different weight percent (wt %) of chemically synthesized Zinc Oxide (ZnO) nanorods into polymethylmethacrylate (PMMA). Current-voltage (I-V) measurements of the spin coated ZnO+PMMA nanocomopsite thin film on indium tin oxide (ITO) coated glass substrate showed current hysteresis behaviour, which is an indication of memory effect. The samples exhibit two distinct resistance states, ON and OFF states, characterised by relatively low and high resistance of the OBDs, respectively. It is also observed that with change in ZnO dopant concentration the value of ON/OFF current changes. Higher ON/OFF current ratio is desired for practical applications. Current conduction mechanism of the devices has been explained invoking various existing models, and it has been found that the trapped-charge-limited conduction mechanism was dominant in our samples.

  18. Heteroepitaxial ZnO films on diamond: Optoelectronic properties and the role of interface polarity

    SciTech Connect

    Schuster, Fabian Hetzl, Martin; Garrido, Jose A.; Stutzmann, Martin; Magén, Cesar; Arbiol, Jordi

    2014-06-07

    We demonstrate the growth of heteroepitaxial ZnO films on (110) diamond substrates by molecular beam epitaxy and report on a major advance in structural quality, as confirmed by XRD and high-resolution TEM measurements. The growth direction is found to be along the polar c-axis with Zn-polarity, deduced from annular bright-field scanning transmission electron microscopy imaging. This is important information, as simulations of the electronic band structure reveal the ZnO polarity to dominate the electronic structure of the interface: the formation of a two-dimensional electron gas on the ZnO side or a two-dimensional hole gas on the diamond side are predicted for Zn- and O-polarity, respectively. In addition, photoluminescence and absorption studies exhibit good optical properties and reveal stimulated emission for optical excitation above a threshold of 30 kW/cm{sup 2}.

  19. Structural and Optical Characterization of ZnO Nanoparticles Thin Film via Oxidizing Zn in Ethanol

    NASA Astrophysics Data System (ADS)

    Ooi, M. D. Johan; Aziz, A. Abdul; Abdullah, M. J.

    2010-07-01

    In this work, a study on structural and optical properties of ZnO nanoparticles thin film synthesized by decomposing zinc powder with iodine in absolute ethanol on p- type Si (111) have been carried out. Diameter of about 20 to 90 nm in size was observed during 3 minutes heat treatment deposited at 1150 °C. The structural properties of ZnO nanoparticles for different reaction time (1, 3 and 5 hours) were studied by X-Ray Diffraction (XRD) and Transmission Electron Microscope (TEM) whereas the optical property was observed using room temperature photoluminescence (PL) spectroscopy. The synthesized ZnO nanoparticles show a strong single UV emission peak at 378 nm.

  20. Enhanced luminescence in Eu-doped ZnO nanocrystalline films

    SciTech Connect

    Suzuki, Keigo Murayama, Koji; Tanaka, Nobuhiko

    2015-07-20

    We found an enhancement of Eu{sup 3+} emissions in Eu-doped ZnO nanocrystalline films fabricated by microemulsion method. The Eu{sup 3+} emission intensities were increased by reducing annealing temperatures from 633 K to 533 K. One possible explanation for this phenomenon is that the size reduction enhances the energy transfer from ZnO nanoparticles to Eu{sup 3+} ions. Also, the shift of the charge-transfer band into the low-energy side of the absorption edge is found to be crucial, which seems to expedite the energy transfer from O atoms to Eu{sup 3+} ions. These findings will be useful for the material design of Eu-doped ZnO phosphors.

  1. Effect of thermal annealing on properties of polycrystalline ZnO thin films

    NASA Astrophysics Data System (ADS)

    Gritsenko, L. V.; Abdullin, Kh. A.; Gabdullin, M. T.; Kalkozova, Zh. K.; Kumekov, S. E.; Mukash, Zh. O.; Sazonov, A. Yu.; Terukov, E. I.

    2017-01-01

    Electrical properties (density, carriers mobility, resistivity), optical absorption and photoluminescence spectra of ZnO, grown by MOCVD and hydrothermal methods, have been investigated depending on the annealing and treatment modes in a hydrogen plasma. It has been shown that the electrical and photoluminescent (PL) properties of ZnO are strongly dependent on gas atmosphere during annealing. The annealing in oxygen atmosphere causes a sharp drop of carrier mobility and films conductivity due to the absorption of oxygen on grain boundaries. The process of ZnO electrical properties recovery by the thermal annealing in inert atmosphere (nitrogen), in oil (2×10-2 mbar) and oil-free (1×10-5 mbar) vacuum has been investigated. The hydrogen plasma treatment influence on the intensity of near-band-gap emission (NBE) has been studied. The effect of annealing and subsequent plasma treatment on PL intensity depends on the gas atmosphere of preliminary thermal annealing.

  2. Gd doping effect on structural, electrical and magnetic properties of ZnO thin films synthesized by sol-gel spin coating technique

    NASA Astrophysics Data System (ADS)

    Kumar, Sanjeev; Thangavel, Rajalingam

    2017-03-01

    Nanocrystalline Gd-doped ZnO thin films were deposited on sapphire (0001) substrates using sol-gel spin coating technique. The structural and optical properties of deposited thin films were characterized by X-ray diffraction (XRD) and micro Raman spectroscopy. Structural and optical studies show that the doped Gd ions occupy Zn sites retaining the wurtzite symmetry. Photoluminescence (PL) studies reveal the presence of oxygen vacancies in Gd doped ZnO thin films. The resistivity of Gd doped ZnO thin film decreases with increase in Gd doping upto 4%. Gd-doped ZnO films demonstrate weak magnetic ordering at room temperature.

  3. Photoluminescence enhancement of ZnO via coupling with surface plasmons on Al thin films

    NASA Astrophysics Data System (ADS)

    Dellis, S.; Kalfagiannis, N.; Kassavetis, S.; Bazioti, C.; Dimitrakopulos, G. P.; Koutsogeorgis, D. C.; Patsalas, P.

    2017-03-01

    We present that the ultra-violet emission of ZnO can be enhanced, as much as six-times its integral intensity, using an Al thin interlayer film between the Si substrate and ZnO thin film and a post-fabrication laser annealing process. The laser annealing is a cold process that preserves the chemical state and integrity of the underlying aluminum layer, while it is essential for the improvement of the ZnO performance as a light emitter and leads to enhanced emission in the visible and in the ultraviolet spectral ranges. In all cases, the metal interlayer enhances the intensity of the emitted light, either through coupling of the surface plasmon that is excited at the Al/ZnO interface, in the case of light-emitting ZnO in the ultraviolet region, or by the increased back reflection from the Al layer, in the case of the visible emission. In order to evaluate the process and develop a solid understanding of the relevant physical phenomena, we investigated the effects of various metals as interlayers (Al, Ag, and Au), the metal interlayer thickness, and the incorporation of a dielectric spacer layer between Al and ZnO. Based on these experiments, Al emerged as the undisputable best choice of metal interlayers because of its compatibility with the laser annealing process, as well as due to its high optical reflectivity at 380 and 248 nm, which leads to the effective coupling with surface plasmons at the Al/ZnO interfaces at 380 nm and the secondary annealing of ZnO by the back-reflected 248 nm laser beam.

  4. Microfluidic pumps employing surface acoustic waves generated in ZnO thin films

    SciTech Connect

    Du, X. Y.; Flewitt, A. J.; Milne, W. I.; Fu, Y. Q.; Luo, J. K.

    2009-01-15

    ZnO thin film based surface acoustic wave (SAW) devices have been utilized to fabricate microfluidic pumps. The SAW devices were fabricated on nanocrystalline ZnO piezoelectric thin films deposited on Si substrates using rf magnetron sputtering and use a Sezawa wave mode for effective droplet motion. The as-deposited ZnO surface is hydrophilic, with a water contact angle of {approx}75 deg., which prevents droplet pumping. Therefore, the ZnO surface was coated using a self-assembled monolayer of octadecyltrichlorosilane which forms a hydrophobic surface with a water contact angle of {approx}110 deg. Liquid droplets between 0.5 and 1 {mu}l in volume were successfully pumped on the hydrophobic ZnO surface at velocities up to 1 cm s{sup -1}. Under acoustic pressure, the water droplet on an hydrophilic surface becomes deformed, and the asymmetry in the contact angle at the trailing and leading edges allow the force acting upon the droplet to be calculated. These forces, which increase with input voltage above a threshold level, are found to be in the range of {approx}100 {mu}N. A pulsed rf signal has also been used to demonstrate precision manipulation of the liquid droplets. Furthermore, a SAW device structure is demonstrated in which the ZnO piezoelectric only exists under the input and output transducers. This structure still permits pumping, while avoiding direct contact between the piezoelectric material and the fluid. This is of particular importance for biological laboratory-on-a-chip applications.

  5. Structural and optical properties of Ni added ZnO thin films deposited by sol-gel method

    NASA Astrophysics Data System (ADS)

    Murugan, R.; Vijayaprasath, G.; Mahalingam, T.; Anandhan, N.; Ravi, G.

    2014-04-01

    Pure and Ni added zinc oxide thin films were prepared by sol-gel method using spin-coating technique on glass substrates. The influences of nickel on ZnO thin films are characterized by Powder X-ray diffraction study. Pure and Ni added thin films are hexagonal wurtzite structure without any secondary phase in c-axis orientation. The SEM images of thin films show uniform sphere like particles covered completely on glass substrates. All the films exhibit transmittance of 85-95% in the visible range up to 800nm and cut-off wavelength observed at 394 nm corresponding to the fundamental absorption of ZnO. The photoluminescence property for pure and Ni added ZnO thin films has been studied and results are presented in detail.

  6. Structural and optical properties of Ni added ZnO thin films deposited by sol-gel method

    SciTech Connect

    Murugan, R.; Vijayaprasath, G.; Anandhan, N. E-mail: gravicrc@gmail.com; Ravi, G. E-mail: gravicrc@gmail.com; Mahalingam, T.

    2014-04-24

    Pure and Ni added zinc oxide thin films were prepared by sol-gel method using spin-coating technique on glass substrates. The influences of nickel on ZnO thin films are characterized by Powder X-ray diffraction study. Pure and Ni added thin films are hexagonal wurtzite structure without any secondary phase in c-axis orientation. The SEM images of thin films show uniform sphere like particles covered completely on glass substrates. All the films exhibit transmittance of 85-95% in the visible range up to 800nm and cut-off wavelength observed at 394 nm corresponding to the fundamental absorption of ZnO. The photoluminescence property for pure and Ni added ZnO thin films has been studied and results are presented in detail.

  7. Preparation of dye-adsorbing ZnO thin films by electroless deposition and their photoelectrochemical properties.

    PubMed

    Nagaya, Satoshi; Nishikiori, Hiromasa

    2013-09-25

    Dye-adsorbing ZnO thin films were prepared on ITO films by electroless deposition. The films were formed in an aqueous solution containing zinc nitrate, dimethylamine-borane, and eosin Y at 328 K. The film thickness was 1.2-2.0 μm. Thinner and larger-plane hexagonal columns were produced from the solution containing a higher concentration of eosin Y. A photocurrent was observed in the electrodes containing such ZnO films during light irradiation. The photoelectrochemical performance of the film was improved by increasing the concentration of eosin Y because of increases in the amount of absorbed photons and the electronic conductivity of ZnO.

  8. ZnO thin film piezoelectric MEMS vibration energy harvesters with two piezoelectric elements for higher output performance.

    PubMed

    Wang, Peihong; Du, Hejun

    2015-07-01

    Zinc oxide (ZnO) thin film piezoelectric microelectromechanical systems (MEMS) based vibration energy harvesters with two different designs are presented. These harvesters consist of a silicon cantilever, a silicon proof mass, and a ZnO piezoelectric layer. Design I has a large ZnO piezoelectric element and Design II has two smaller and equally sized ZnO piezoelectric elements; however, the total area of ZnO thin film in two designs is equal. The ZnO thin film is deposited by means of radio-frequency magnetron sputtering method and is characterized by means of XRD and SEM techniques. These ZnO energy harvesters are fabricated by using MEMS micromachining. The natural frequencies of the fabricated ZnO energy harvesters are simulated and tested. The test results show that these two energy harvesters with different designs have almost the same natural frequency. Then, the output performance of different ZnO energy harvesters is tested in detail. The effects of series connection and parallel connection of two ZnO elements on the load voltage and power are also analyzed. The experimental results show that the energy harvester with two ZnO piezoelectric elements in parallel connection in Design II has higher load voltage and higher load power than the fabricated energy harvesters with other designs. Its load voltage is 2.06 V under load resistance of 1 MΩ and its maximal load power is 1.25 μW under load resistance of 0.6 MΩ, when it is excited by an external vibration with frequency of 1300.1 Hz and acceleration of 10 m/s(2). By contrast, the load voltage of the energy harvester of Design I is 1.77 V under 1 MΩ resistance and its maximal load power is 0.98 μW under 0.38 MΩ load resistance when it is excited by the same vibration.

  9. Thickness-dependent growth orientation of F-doped ZnO films formed by atomic layer deposition

    SciTech Connect

    Kang, Kyung-Mun; Choi, Yong-June; Park, Hyung-Ho; Yeom, Geun Young

    2016-01-15

    ZnO thin films were doped with fluorine using atomic layer deposition (ALD) with an in-house F source at a deposition temperature of 140 °C. Structural and morphological properties of the resulting F-doped ZnO (ZnO:F) films were investigated by x-ray diffraction analysis, field emission scanning electron microscopy, and grazing incidence wide-angle x-ray diffraction. During the initial growth stage of up to 200 ALD cycles, no difference was observed between the preferred growth orientations of undoped ZnO and ZnO:F films. However, after 300 ALD cycles, ZnO and ZnO:F films showed (002) and (100) preferred orientation, respectively. This difference in preferred growth orientation arose from the perturbation-and-passivation effect of F doping, which involves F anions filling the oxygen-related defect sites in the ZnO lattice. Ultraviolet photoelectron spectroscopic analyses were carried out to investigate the surface plane dependency of the films' work functions, which confirmed that the ZnO and ZnO:F films had different growth behaviors.

  10. Variable range hopping crossover and magnetotransport in PLD grown Sb doped ZnO thin film

    NASA Astrophysics Data System (ADS)

    Mukherjee, Joynarayan; Mannam, Ramanjaneyulu; Ramachandra Rao, M. S.

    2017-04-01

    We report on the variable range hopping (VRH) crossover in the electrical transport of Sb doped ZnO (SZO) thin film. Structural, chemical, electrical and magnetotransport properties were carried out on SZO thin film grown by pulsed laser deposition. X-photoelectron spectroscopy study confirms the presence of both Sb3+(33%) and Sb5+(67%) states. Sb doped ZnO thin film shows n-type behavior which is attributed to the formation of SbZn and/or SbZn–VZn defect complex. Temperature dependent resistivity measurement showed that in a low temperature regime (< 90 K) transport is governed by the 3D-VRH mechanism. A crossover from 3D-VRH to Efros–Shklovoski VRH was observed around 12 K. Negative magnetoresistance (MR) is observed in the entire temperature range (300–5 K), however, there is an upturn in the MR behavior at 5 K suggesting the existence of a positive component. The MR behavior of Sb doped ZnO thin films is explained by the Khosla and Fischer model.

  11. Photoluminescence, ellipsometric, optical and morphological studies of sprayed Co-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Gençyılmaz, O.; Atay, F.; Akyüz, I.

    2016-06-01

    In this study, undoped and cobalt (Co)-doped zinc oxide (ZnO) films were successfully produced by ultrasonic spray pyrolysis (USP) technique at low temperature (350°C). The optical and surface properties were investigated as a function of Co content. The optical parameters (thickness, refractive index and extinction coefficient) were determined using spectroscopic ellipsometry (SE) and it was seen that the refractive index and extinction coefficient values of Co-doped ZnO films decreased slightly depending on the increasing of Co doping. For investigation, the transmittance and photoluminescence (PL) spectra of the films, UV-Vis spectrophotometer and PL spectroscopy were used at room temperature. The transmittance spectra show that transmittance values decreased and Co+2 ions substitute Zn+2 ions of ZnO lattice. The optical band gap values decreased from 3.26 eV to 2.85 eV with the changing of Co content. The results of PL spectra exhibit the position of the different emission peaks unchanged but the intensity of peaks increased with increasing Co doping. Also, the surface properties of the films were obtained by atomic force microscopy (AFM) and these results indicated that the surface morphology and roughness values were prominently changed with Co doping.

  12. Reflection Properties of Metallic Gratings on ZnO Films over GaAs Substrates

    NASA Technical Reports Server (NTRS)

    Hickernell, Fred S.; Kim, Yoonkee; Hunt, William D.

    1994-01-01

    A potential application for piezoelectric film deposited on GaAs substrates is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Metallic gratings are basic elements required for the construction of such devices, and analyzing the reflectivity and the velocity change due to metallic gratings is often a critical design parameter. In this article, Datta and Hunsinger technique is extended to the case of a multilayered structure, and the developed technique is applied to analyze shorted and open gratings on ZnO films sputtered over (001)-cut (110)-propagating GaAs substrates. The analysis shows that zero reflectivity of shorted gratings can be obtained by a combination of the ZnO film and the metal thickness and the metalization ratio of the grating. Experiments are performed on shorted and an open gratings (with the center frequency of about 180 MHz) for three different metal thicknesses over ZnO films which are 0.8 and 2.6 micrometers thick. From the experiments, zero reflectivity at the resonant frequency of the grating is observed for a reasonable thickness (h/Alpha = 0.5%) of aluminum metalization. The velocity shift between the shorted and the open grating is also measured to be 0.18 MHz and 0.25 MHz for 0.8 and 1.6 micrometers respectively. The measured data show relatively good agreement with theoretical predictions.

  13. Magnetic Coupling of Dissimilar ZnO-Co Granular Films Through a ZnO Spacer

    NASA Astrophysics Data System (ADS)

    Li, Xiaoli; Jia, Juan; Gao, Yan; Gehring, G. A.; Xu, Xiaohong

    2015-12-01

    An all-oxide granular film (GF) with a sandwich structure containing cobalt metal nanoparticles embedded in ZnO is fabricated by magnetron sputtering. Large and small Co particles can be obtained simultaneously in a sample by depositing nanostructured ZnO-Co layers at high and low temperatures, respectively. The two ZnO-Co layers couple with each other through a ZnO spacer layer, whose thickness tunes the strength of the coupling. Both the magnetic properties and the magnetoresistance (MR) of the samples depend on the sandwich structure. Magnetic interactions can be transferred through the polycrystalline pure ZnO spacer layer even when the layer is as thick as 40nm due to the long spin coherence length. An analysis of the data found that the spin coherence length was greater than ˜17nm at room temperature (RT) in a polycrystalline film with very small grains. Tuning the resistance of the ZnO-Co layer deposited at a low temperature by adding aluminum so that it more nearly matches the resistance of the ZnO-Co layer deposited at a high temperature, dramatically enhances the MR of the sandwich sample. This study illustrates the power of combining films containing different sizes of nanoparticles in order to optimize the MR and so make the ZnO-based films more suitable for applications in spintronics.

  14. Improved electrical, optical, and structural properties of undoped ZnO thin films grown by water-mist-assisted spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Martínez Pérez, L.; Aguilar-Frutis, M.; Zelaya-Angel, O.; Muñoz Aguirre, N.

    2006-08-01

    Undoped ZnO thin films were prepared using the ultrasonic spray pyrolysis deposition technique with zinc acetylacetonate dissolved in N,N-dimethylformamide as the source materials solution. The addition of water mist in a parallel flux to the spray solution stream was also used during deposition of the films. The addition of water mist improved the electrical characteristics of the ZnO films. Fresh ZnO samples were then thermally annealed in a H2 reducing atmosphere. X-ray diffraction patterns show mainly the wurzite crystalline ZnO phase in the films. An electrical resistivity ( ) of around 2.7 × 10-2 cm was measured at room temperature for the best undoped ZnO film. is approximately one order of magnitude lower than the resistivities found in undoped ZnO films obtained by means of similar non-vacuum deposition techniques.

  15. Nanostructured ZnO thin films prepared by sol-gel spin-coating

    NASA Astrophysics Data System (ADS)

    Heredia, E.; Bojorge, C.; Casanova, J.; Cánepa, H.; Craievich, A.; Kellermann, G.

    2014-10-01

    ZnO thin films deposited on silica flat plates were prepared by spin-coating and studied by applying several techniques for structural characterization. The films were prepared by depositing different numbers of layers, each deposition being followed by a thermal treatment at 200 °C to dry and consolidate the successive layers. After depositing all layers, a final thermal treatment at 450 °C during 3 h was also applied in order to eliminate organic components and to promote the crystallization of the thin films. The total thickness of the multilayered films - ranging from 40 nm up to 150 nm - was determined by AFM and FESEM. The analysis by GIXD showed that the thin films are composed of ZnO crystallites with an average diameter of 25 nm circa. XR results demonstrated that the thin films also exhibit a large volume fraction of nanoporosity, typically 30-40 vol.% in thin films having thicknesses larger than ∼70 nm. GISAXS measurements showed that the experimental scattering intensity is well described by a structural model composed of nanopores with shape of oblate spheroids, height/diameter aspect ratio within the 0.8-0.9 range and average diameter along the sample surface plane in the 5-7 nm range.

  16. The role of seeding in the morphology and wettability of ZnO nanorods films on different substrates

    NASA Astrophysics Data System (ADS)

    Rodríguez, Juan; Onna, Diego; Sánchez, Luis; Marchi, M. Claudia; Candal, Roberto; Ponce, Silvia; Bilmes, Sara A.

    2013-08-01

    Spray pyrolysis (SP) and spray-gel (SG) techniques were used to deposit ZnO seeds on Fluor doped tin oxide glasses (FTO), heated at 350 °C or 130 °C, and PET heated at 90 °C. The effect of seeding on the morphology and wettability of ZnO nanorods (NRs) films grown by wet chemical methods was analyzed. The morphology and wettability of ZnO NRs films depend on the seeding process. SP seeds formed from zinc acetate dissolved in water ethanol mixtures yield vertically aligned ZnO NRs, whose diameters and dispersion size are determined by the ethanol/water ratio in the precursor solution. SG seeds formed from a methanol ZnO sol produce a ring patterned distribution on the FTO substrate. The drying of ZnO sol drops impinging on the substrate produces high density of seeds along a ring yielding textured films with NRs vertically oriented on the rings and multi-oriented outside them. This effect was not observed when ZnO NRs grown onto the ZnO/PET substrate, however rod diameter is related with the density of seeds. This way to control the density and diameter of NRs deposited onto a substrate modify the wettability and opens new possibilities for the design of tailored nanomaterials for photochemical applications. Both type of NRs films showed a strong luminescence emission in the UV and in the blue, associated with surface and intrinsic defects.

  17. ZnO thin films on single carbon fibres fabricated by Pulsed Laser Deposition (PLD)

    NASA Astrophysics Data System (ADS)

    Krämer, André; Engel, Sebastian; Sangiorgi, Nicola; Sanson, Alessandra; Bartolomé, Jose F.; Gräf, Stephan; Müller, Frank A.

    2017-03-01

    Single carbon fibres were 360° coated with zinc oxide (ZnO) thin films by pulsed laser deposition using a Q-switched CO2 laser with a pulse duration τ ≈ 300 ns, a wavelength λ = 10.59 μm, a repetition frequency frep = 800 Hz and a peak power Ppeak = 15 kW in combination with a 3-step-deposition technique. In a first set of experiments, the deposition process was optimised by investigating the crystallinity of ZnO films on silicon and polished stainless steel substrates. Here, the influence of the substrate temperature and of the oxygen partial pressure of the background gas were characterised by scanning electron microscopy and X-ray diffraction analyses. ZnO coated carbon fibres and conductive glass sheets were used to prepare photo anodes for dye-sensitised solar cells in order to investigate their suitability for energy conversion devices. To obtain a deeper insight of the electronic behaviour at the interface between ZnO and substrate I-V measurements were performed.

  18. Characterization of piesoelectric ZnO thin films and the fabrication of piezoelectric micro-cantilevers

    SciTech Connect

    Johnson, Raegan Lynn

    2005-01-01

    In Atomic Force Microscopy (AFM), a microcantilever is raster scanned across the surface of a sample in order to obtain a topographical image of the sample's surface. In a traditional, optical AFM, the sample rests on a bulk piezoelectric tube and a control loop is used to control the tip-sample separation by actuating the piezo-tube. This method has several disadvantages--the most noticeable one being that response time of the piezo-tube is rather long which leads to slow imaging speeds. One possible solution aimed at improving the speed of imaging is to incorporate a thin piezoelectric film on top of the cantilever beam. This design not only improves the speed of imaging because the piezoelectric film replaces the piezo-tube as an actuator, but the film can also act as a sensor. In addition, the piezoelectric film can excite the cantilever beam near its resonance frequency. This project aims to fabricate piezoelectric microcantilevers for use in the AFM. Prior to fabricating the cantilevers and also part of this project, a systematic study was performed to examine the effects of deposition conditions on the quality of piezoelectric ZnO thin films deposited by RF sputtering. These results will be presented. The deposition parameters that produced the highest quality ZnO film were used in the fabrication of the piezoelectric cantilevers. Unfortunately, the fabricated cantilevers warped due to the intrinsic stress of the ZnO film and were therefore not usable in the AFM. The complete fabrication process will be detailed, the results will be discussed and reasons for the warping will be examined.

  19. Thin Solid Films Topical Special Issue on ZnO related transparent conductive oxides

    SciTech Connect

    Chu, Jinn P.; Endo, Tamio; Ellmer, Klaus; Gessert, Tim; Ginley, David

    2016-04-01

    World-wide research activities on ZnO and related transparent conductive oxides (TCO) in thin film, nanostructured, and multilayered forms are driven by the vast potential of these materials for optoelectronic, microelectronic, and photovoltaic applications. Renewed interest in ZnO applications is partly stimulated by cost reduction in material processing and device development. One of the most important issues is doping and alloying with Al, Ga, In, Sn, etc. in order to tune properties. When highly doped, these materials are used as transparent-conducting contacts on solar cells, as well as in catalytic, spintronic, and surface acoustic wave devices. Film growth conditions, including substrate type and orientation, growth temperature, deposition rate, and ambient atmosphere, all play important roles in determining structural, electrical, magnetic, and optical properties.

  20. Perovskite solar cells based on nanocolumnar plasma-deposited ZnO thin films.

    PubMed

    Ramos, F Javier; López-Santos, Maria C; Guillén, Elena; Nazeeruddin, Mohammad Khaja; Grätzel, Michael; Gonzalez-Elipe, Agustin R; Ahmad, Shahzada

    2014-04-14

    ZnO thin films having a nanocolumnar microstructure are grown by plasma-enhanced chemical vapor deposition at 423 K on pre-treated fluorine-doped tin oxide (FTO) substrates. The films consist of c-axis-oriented wurtzite ZnO nanocolumns with well-defined microstructure and crystallinity. By sensitizing CH3NH3PbI3 on these photoanodes a power conversion of 4.8% is obtained for solid-state solar cells. Poly(triarylamine) is found to be less effective when used as the hole-transport material, compared to 2,2',7,7'-tetrakis(N,N-di-p-methoxyphenylamine)-9,9'-spirobifluorene (spiro-OMeTAD), while the higher annealing temperature of the perovskite leads to a better infiltration in the nanocolumnar structure and an enhancement of the cell efficiency.

  1. Characterization and Fabrication of ZnO Nanowires Grown on AlN Thin Film

    SciTech Connect

    Yousefi, Ramin; Kamaluddin, Burhanuddin; Ghoranneviss, Mahmood; Hajakbari, Fatemeh

    2009-07-07

    In this paper, we report ZnO nanowires grown on AlN thin film deposited on glass as substrate by physical vapour deposition. The temperature of substrates was kept between 600 deg. C and 500 deg. C during the growth. The typical average diameters of the obtained nanowires on substrate at 600 deg. C and 500 deg. C was about 57 nm and 22 nm, respectively with several micrometers in lengths. X-ray diffraction and Auger spectroscopy results showed Al diffused from AlN thin film into ZnO nanowires for sample at high temperature zone. In the photoluminescence spectra two emission bands appeared, one related to ultraviolet emission with a strong peak at 380-382 nm, and another related to deep level emission with a weak peak at 510 nm.

  2. Semiconducting Properties of Swift Au Ion-Irradiated ZnO Thin Films at Room Temperature

    NASA Astrophysics Data System (ADS)

    Kwon, Sera; Park, Hyun-Woo; Chung, Kwun-Bum

    2017-02-01

    The semiconducting properties of Au ion-irradiated ZnO thin films were investigated as a function of ion irradiation dose at room temperature. The Au ion irradiation was conducted with acceleration energy of 130 MeV in the ion dose range from 1 × 1011 to 5 × 1012 ions/cm2. The physical properties showed no change regardless of the Au ion irradiation dose; however, the electrical properties of Au ion-irradiated ZnO thin films changed, depending on the Au ion irradiation dose. The electronic structure drastically changed with the evolution of hybridized molecular orbital structure for the conduction band and band edge states below the conduction band. These remarkable changes in electronic structure correlate with changes in electrical properties, such as carrier concentration and mobility.

  3. Recent advances in the transparent conducting ZnO for thin-film Si solar cells

    NASA Astrophysics Data System (ADS)

    Moon, Taeho; Shin, Gwang Su; Park, Byungwoo

    2015-11-01

    The key challenge for solar-cell development lies in the improvement of power-conversion efficiency and the reduction of fabrication cost. For thin-film Si solar cells, researches have been especially focused on the light trapping for the breakthrough in the saturated efficiencies. The ZnO-based transparent conducting oxides (TCOs) have therefore received strong attention because of their excellent light-scattering capability by the texture-etched surface and cost effectiveness through in-house fabrication. Here, we have highlighted our recent studies on the transparent conducting ZnO for thin-film Si solar cells. From the electrical properties and their degradation mechanisms, bilayer deposition and organic-acid texturing approaches for enhancing the light trapping, and finally the relation between textured ZnO and electrical cell performances are sequentially introduced in this review article. [Figure not available: see fulltext.

  4. Modification of the optical properties of ZnO thin films by proton implantation

    SciTech Connect

    Ham, Yong Ju; Park, Jun Kue; Lee, W.; Lee, Cheol Eui; Park, W.

    2012-09-15

    Highlights: ► Optical properties of proton-implanted ZnO thin film prepared by rf magneton sputtering were studied. ► Increase in the ordinary refractive index after proton implantation was explained by the polarizability. ► A slight decrease in the optical bandgap by proton implantation was identified. -- Abstract: Optical properties of proton-implanted ZnO thin film prepared by radio-frequency (rf) magneton sputtering have been studied, the optical constants being obtained from the reflectance measurements by employing Cauchy–Urbach model. Increase in the ordinary refractive index after proton implantation was explained by that in the polarizability. Besides, a slight increase in the optical band gap by proton implantation was identified and discussed in terms of the hydrogen shallow donors introduced by the proton implantation.

  5. ZnO thin-film transistors with a polymeric gate insulator built on a polyethersulfone substrate

    NASA Astrophysics Data System (ADS)

    Hyung, Gun Woo; Park, Jaehoon; Koo, Ja Ryong; Choi, Kyung Min; Kwon, Sang Jik; Cho, Eou Sik; Kim, Yong Seog; Kim, Young Kwan

    2012-03-01

    Zinc oxide (ZnO) thin-film transistors (TFTs) with a cross-linked poly(vinyl alcohol) (c-PVA) insulator are fabricated on a polyethersulfone substrate. The ZnO film, formed by atomic layer deposition, shows a polycrystalline hexagonal structure with a band gap energy of about 3.37 eV. The fabricated ZnO TFT exhibits a field-effect mobility of 0.38 cm2/Vs and a threshold voltage of 0.2 V. The hysteresis of the device is mainly caused by trapped electrons at the c-PVA/ZnO interface, whereas the positive threshold voltage shift occurs as a consequence of constant positive gate bias stress after 5000 s due to an electron injection from the ZnO film into the c-PVA insulator.

  6. Effects of nitrogen on the growth and optical properties of ZnO thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Cui, J. B.; Thomas, M. A.; Soo, Y. C.; Kandel, H.; Chen, T. P.

    2009-08-01

    ZnO thin films were grown using pulsed laser deposition by ablating a Zn target in various mixtures of O2 and N2. The presence of N2 during deposition was found to affect the growth of the ZnO thin films and their optical properties. Small N2 concentrations during growth led to strong acceptor-related photoluminescence (PL), while larger concentrations affected both the intensity and temperature dependence of the emission peaks. In addition, the PL properties of the annealed ZnO thin films are associated with the N2 concentration during their growth. The possible role of nitrogen in ZnO growth and annealing is discussed.

  7. Physical deoxygenation of graphene oxide paper surface and facile in situ synthesis of graphene based ZnO films

    NASA Astrophysics Data System (ADS)

    Ding, Jijun; Wang, Minqiang; Zhang, Xiangyu; Ran, Chenxin; Shao, Jinyou; Ding, Yucheng

    2014-12-01

    In-situ sputtering ZnO films on graphene oxide (GO) paper are used to fabricate graphene based ZnO films. Crystal structure and surface chemical states are investigated. Results indicated that GO paper can be effectively deoxygenated by in-situ sputtering ZnO on them without adding any reducing agent. Based on the principle of radio frequency magnetron sputtering, we propose that during magnetron sputtering process, plasma streams contain large numbers of electrons. These electrons not only collide with argon atoms to produce secondary electrons but also they are accelerated to bombard the substrates (GO paper) resulting in effective deoxygenation of oxygen-containing functional groups. In-situ sputtering ZnO films on GO paper provide an approach to design graphene-semiconductor nanocomposites.

  8. Physical deoxygenation of graphene oxide paper surface and facile in situ synthesis of graphene based ZnO films

    SciTech Connect

    Ding, Jijun; Wang, Minqiang Zhang, Xiangyu; Ran, Chenxin; Shao, Jinyou; Ding, Yucheng

    2014-12-08

    In-situ sputtering ZnO films on graphene oxide (GO) paper are used to fabricate graphene based ZnO films. Crystal structure and surface chemical states are investigated. Results indicated that GO paper can be effectively deoxygenated by in-situ sputtering ZnO on them without adding any reducing agent. Based on the principle of radio frequency magnetron sputtering, we propose that during magnetron sputtering process, plasma streams contain large numbers of electrons. These electrons not only collide with argon atoms to produce secondary electrons but also they are accelerated to bombard the substrates (GO paper) resulting in effective deoxygenation of oxygen-containing functional groups. In-situ sputtering ZnO films on GO paper provide an approach to design graphene-semiconductor nanocomposites.

  9. Enhanced electron field emission from ZnO nanoparticles-embedded DLC films prepared by electrochemical deposition

    NASA Astrophysics Data System (ADS)

    Zhang, Peizeng; Li, Ruishan; Yang, Hua; Feng, Youcai; Xie, Erqing

    2012-06-01

    ZnO nanoparticles-embedded diamond-like amorphous (DLC) carbon films have been prepared by electrochemical deposition. Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) results confirm that the embedded ZnO nanoparticles are in the wurtzite structure with diameters of around 4 nm. Based on Raman measurements and atomic force microscope (AFM) results, it has been found that ZnO nanoparticles embedding could enhance both graphitization and surface roughness of DLC matrix. Also, the field electron emission (FEE) properties of the ZnO nanoparticles-embedded DLC film were improved by both lowering the turn-on field and increasing the current density. The enhancement of the FEE properties of the ZnO-embedded DLC film has been analyzed in the context of microstructure and chemical composition.

  10. ZnO thin film as MSG for sensitive biosensor

    NASA Astrophysics Data System (ADS)

    Iftimie, N.; Savin, A.; Steigmann, R.; Faktorova, D.; Salaoru, I.

    2016-08-01

    In this paper, we investigate the cholesterol sensors consisting of a mixture of cholesterol oxidase (ChOx) and zinc oxide (ZnO) nanoparticles were grown on ITO/glass substrates by vacuum thermal evaporation method and their sensing characteristics are examined in air. Also, the interest in surface waves appeared due to evanescent waves in the metallic strip grating in sub-wavelength regime. Before testing the transducer with metamaterials lens in the sub-wavelength regime, a simulation of the evanescent wave's formation has been performed at the edge of Ag strips, with thicknesses in the range of micrometers.

  11. Surface Texture and Structure of ZnO Films Synthesized by Off-Axis Sputtering Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, Ching-Hua; Lehoczky, Sandor L.; George, M. A.; Lowndes, D. H.

    1999-01-01

    Morphology and structure of ZnO films deposited on (0001) sapphire and glass substrates by off-axis sputtering are investigated at various temperatures and pressures. All films show highly textured structures on glass substrates and epitaxial growth on sapphire substrates. The full width at half maximum of theta rocking curves for epitaxial films is less than 0.5 degrees. In textured films, it rises to several degrees. The trend of surface textures in films grown at low pressures is similar to those grown at high temperatures. A morphology transition from large well-defined hexagonal grains to flat surface was observed at a pressure of 50 mtorr and temperature of 550 C. The experiment results are explained by the transport behavior of depositing species.

  12. Characterization of nanostructured ZnO thin films deposited through vacuum evaporation

    PubMed Central

    Maldonado, Arturo; Juarez, Héctor; Pacio, Mauricio; Perez, Rene

    2015-01-01

    Summary This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilometry. XRD patterns of the deposited thin films were obtained. According to the HRSEM micrographs worm-shaped nanostructures are observed in samples annealed at 600 °C and this characteristic disappears as the annealing temperature increases. The films obtained were annealed from 25 to 1000 °C, showing a gradual increase in transmittance spectra up to 85%. The optical band gaps obtained for these films are about 3.22 eV. The PL measurement shows an emission in the red and in the violet region and there is a correlation with the annealing process. PMID:25977868

  13. Characterization of nanostructured ZnO thin films deposited through vacuum evaporation.

    PubMed

    Alvarado, Jose Alberto; Maldonado, Arturo; Juarez, Héctor; Pacio, Mauricio; Perez, Rene

    2015-01-01

    This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilometry. XRD patterns of the deposited thin films were obtained. According to the HRSEM micrographs worm-shaped nanostructures are observed in samples annealed at 600 °C and this characteristic disappears as the annealing temperature increases. The films obtained were annealed from 25 to 1000 °C, showing a gradual increase in transmittance spectra up to 85%. The optical band gaps obtained for these films are about 3.22 eV. The PL measurement shows an emission in the red and in the violet region and there is a correlation with the annealing process.

  14. Interfacial structure and electrical properties of transparent conducting ZnO thin films on polymer substrates.

    PubMed

    Lim, Young Soo; Kim, Dae Wook; Kang, Jong-Ho; Seo, Seul Gi; Kim, Bo Bae; Choi, Hyoung-Seuk; Seo, Won-Seon; Cho, Yong Soo; Park, Hyung-Ho

    2013-08-01

    The effects of polymer substrates on the interfacial structure and the thermal stability of Ga-doped ZnO (GZO) thin films were investigated. The GZO thin films were deposited on polyethylene terephthalate (PET) and polyethylene naphthalate (PEN) substrates by rf-magnetron sputtering at room temperature, and thermal stability tests of the GZO thin films on the polymer substrates were performed at 150°C up to 8 h in air. Electrical and structural characterizations of the GZO thin films on the PET and the PEN substrates were carried out, and the origins of the stable interfacial structure and the improved thermal stability of the GZO thin film on the PEN substrate were discussed.

  15. Orientation Effects in ZnO Films Using Off-Axis Sputtering Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Su, Ching-Hua; Lehoczky, S.; George, M. A.

    1999-01-01

    ZnO is a wide-band-gap oxide material and has been used in numerous applications. It is also a good substrate for fabricating GaN-based (a blue laser candidate) devices. Off-axis sputtering technique is one of the best techniques in synthesizing oxide materials because negative ion bombardment and particle kinetic energy is greatly reduced when adatoms condense on substrates. Since the sputtered material from the target arrive on the substrate surface at a 90 deg. configuration, which differs from the normal sputtering geometry, it is expected that the film uniformity and composition distributions will be affected. However, the details of these properties and mechanisms have not been well studied. ZnO films are synthesized on (0001) sapphire and quartz substrates by off-axis sputtering deposition in various oxygen/argon mixture ratios and pressures at different temperatures. Substrates and sputtering sources are placed at three different orientations that are orthogonal to each other. The normal direction of a substrate is parallel to the gravity vector and the other is perpendicular to it. Film thickness profiles at different growth orientations are determined using a profimeter. All films grown at high temperatures have highly textured structures on quartz substrates and epitaxially grow on sapphire substrates. Because of this process, the film surface is very smooth. X-ray diffraction, scanning probe microscopy, and Fourier transfer infrared spectroscopy, and electrical measurements will be used to characterize these films. Detailed results will be discussed in the presentation.

  16. Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films

    NASA Astrophysics Data System (ADS)

    Zhang, Wei-li; Wang, Qing-yue; Chai, Lu; Xing, Qi-rong; K, Wong S.; H, Wang; Z, Tang K.; G, Wong K. L.; R, Jain

    1999-06-01

    Transient third-order optical nonlinearity χ(3) of ZnO microcrystallite thin films is measured at various temperatures by using femtosecond degenerate four-wave-mixing. Room-temperature excitonic enhancement of χ(3) is observed. The magnitude of χ(3) ranges between 10-4 to 10-6 esu from 4.2 K to room temperature. The measured χ(3) response time ranging from 200 to 300 fs is ultrafast for temperature down to 4.2 K.

  17. Electrical and optical properties of p-type codoped ZnO thin films prepared by spin coating technique

    NASA Astrophysics Data System (ADS)

    Pathak, Trilok Kumar; Kumar, Vinod; Swart, H. C.; Purohit, L. P.

    2016-03-01

    Undoped, doped and codoped ZnO thin films were synthesized on glass substrates using a spin coating technique. Zinc acetate dihydrate, ammonium acetate and aluminum nitrate were used as precursor for zinc, nitrogen and aluminum, respectively. X-ray diffraction shows that the thin films have a hexagonal wurtzite structure for the undoped, doped and co-doped ZnO. The transmittance of the films was above 80% and the band gap of the film varied from 3.20 eV to 3.24 eV for undoped and doped ZnO. An energy band diagram to describe the photoluminescence from the thin films was also constructed. This diagram includes the various defect levels and possible quasi-Fermi levels. A minimum resistivity of 0.0834 Ω-cm was obtained for the N and Al codoped ZnO thin films with p-type carrier conductivity. These ZnO films can be used as a window layer in solar cells and in UV lasers.

  18. A lateral field excited ZnO film bulk acoustic wave sensor working in viscous environments

    NASA Astrophysics Data System (ADS)

    Chen, Da; Wang, Jingjing; Xu, Yan; Li, Dehua; Zhang, Liuyin; Liu, Weihui

    2013-09-01

    We present a lateral field excited ZnO film bulk acoustic resonator (FBAR) operated in pure-shear mode and analyze its performances in viscous liquids. The electrodes of the device are located on the film surface and normal to the c-axis of the ZnO film. The proposed device works near 1.44 GHz with a Q-factor up to 360 in air and 310 in water, which are higher than those of the quasi-shear thickness field excited FBAR. The resonant frequency is decreased with the increasing square root of the product of the viscosity and density with a linear dependence in the viscosity below 148.7 mPa s. The mass sensitivity of 670 Hz cm2 ng-1 was measured by monitoring the frequency change during the volatilization of saline solution loaded on the resonator. In addition, the levels of the noise and the mass resolutions were measured in various viscous environments. The proposed device yields the mass resolution of 670 Hz cm2 ng-1 and the high mass resolution of 0.06 ng cm-2. These results indicated that the lateral field excited ZnO FBAR had superior sensitivity for the bio-sensing applications in viscous biological liquids.

  19. Photovoltaic performance of Gallium-doped ZnO thin film/Si nanowires heterojunction diodes

    NASA Astrophysics Data System (ADS)

    Akgul, Guvenc; Aksoy Akgul, Funda; Emrah Unalan, Husnu; Turan, Rasit

    2016-04-01

    In this work, photovoltaic performance of Ga-doped ZnO thin film/Si NWs heterojunction diodes was investigated. Highly dense and vertically well-aligned Si NW arrays were successfully synthesised on a p-type (1 0 0)-oriented Si wafer through cost-effective metal-assisted chemical etching technique. Ga-doped ZnO thin films were deposited onto Si NWs via radio frequency magnetron sputtering to construct three-dimensional heterostructures. Photovoltaic characteristics of the fabricated diodes were determined with current density (J)-voltage (V) measurements under simulated solar irradiation of AM 1.5 G. The optimal open-circuit voltage, short-circuit current density, fill factor and power conversion efficiency were found to be 0.37 V, 3.30 mA cm-2, 39.00 and 0.62%, respectively. Moreover, photovoltaic diodes exhibited relatively high external quantum efficiency over the broadband wavelengths between 350 and 1100 nm interval of the spectrum. The observed photovoltaic performance in this study clearly indicates that the investigated device structure composed of Ga-doped ZnO thin film/Si NWs heterojunctions could facilitate an alternative pathway for optoelectronic applications in future, and be a promising alternative candidate for high-performance low-cost new-generation photovoltaic diodes.

  20. Synthesis and Characterization of Varying Concentrations of Ag-doped ZnO Thin Films

    NASA Astrophysics Data System (ADS)

    Hachlica, Justin; Wadie-Ibrahim, Patrick; Sahiner, M. Alper

    Silver doped ZnO is a promising compound for photovoltaic solar cell use. Doping this compound with varying amounts of silver will theoretically make this type of thin film more efficient by reducing the overall resistance and increasing the voltage and current output. The extent of this promise is being tested experimentally, by analysis of both the electrical and the surface roughness properties of the cells. Ag-doped Zinc Oxide is deposited by method of Pulsed Laser Deposition (PLD) onto Indium Tin Oxide (ITO) coated Glass. Annealing effects were also observed by varying the temperature at which the annealing occurred after synthesis of the sample. Thickness is confirmed by use of Ellipsometery. X-Ray Diffraction (XRD) measurements confirmed a ZnO crystal structure on the thin films. The active dopant carrier concentrations were determined using a Hall Effect Measuring System. Finally, the photovoltaic properties of the film are recorded by using a Keithley Source Meter. The structural characterization and electrical results of the effect of Ag doping on ZnO will then be discussed.

  1. Realization of an efficient cholesterol biosensor using ZnO nanostructured thin film.

    PubMed

    Batra, Neha; Tomar, Monika; Gupta, Vinay

    2012-12-21

    A zinc oxide (ZnO) nanostructured thin film synthesized by a vapour phase transport technique on a platinum coated silicon (Pt/Si) substrate has been successfully utilized for the detection of cholesterol. Amperometric and photometric studies reveal that the prepared bioelectrode ChOx/ZnO/Pt/Si is highly sensitive to the detection of cholesterol over a wide concentration range, 0.12-12.93 mM (5-500 mg dl(-1)). The higher sensitivity is attributed to the large surface area of ZnO thin film for effective loading of ChOx besides its high electron communication capability. A relatively low value of the enzyme's kinetic parameter (Michaelis-Menten constant, 1.08 mM) indicates an enhanced affinity of the enzyme (ChOx) towards the analyte (cholesterol). The prepared bioelectrode is found to exhibit a long shelf life of more than 10 weeks, having negligible interference from the presence of other biomolecules present in human serum indicating potential application of the ZnO nanostructured thin film for cholesterol sensing.

  2. Characteristics of Sputtered ZnO Thin Films for an Inverted Organic Solar Cell.

    PubMed

    Park, Yong Seob; Park, Chul Min; Lee, Jaehyeong

    2016-05-01

    Several research groups have claimed high energy conversion efficiency in organic solar cells. However, it still has low efficiency and is unstable, because organic materials are easily oxidized by atmospheric humidity and UV light. In this work, ZnO thin film as the blocking layer attributed to the interference of the injection of the hole from the P3HT and no charge carrier recombination. We obtained the maximum power conversion efficiency of 1.9% under AM 1.5 G spectral illumination of 100 MWcm(-2), when we used a ZnO film of 60 nm and the optimized P3HT:PCBM, and Au as the back electrode to solve the reaction problem of Al electrode and to control the work function between the HOMO level of P3HT and the energy level of the metal electrode. Power conversion efficiency of inverted organic solar cell (IOSC) is significantly dependent on the thickness of the ZnO thin film deposited by unbalanced magnetron sputtering method. Also, the stability of IOSC is measured under ambient conditions.

  3. Oxygen annealing effects on optical properties of ZnO and TiO nanocluster thin film

    NASA Astrophysics Data System (ADS)

    Souza, Ryan; Che, Hui; Tian, Yufeng; Qiang, You; Rodriguez, Rene; Lau, Lisa; Turner, Paul; Tenne, Dmitri

    2009-05-01

    Thin films of zinc oxide (ZnO) and titanium oxides (TiO) were deposited on Si (100) substrate by third generation nanocluster source. Post deposition Oxygen Annealing (OA) effects were evaluated by X-Ray diffraction (XRD), Raman spectroscopy, and photoluminescence (PL). As deposited, diameter of ZnO nanoclusters ˜24 nm and ZnO OA nanoclusters ˜30 nm. As deposited TiO clusters ˜10 nm in diameter, and TiO OA cluster ˜20 nm. XRD shows increased crystal quality and improved ZnO c-axis crystal growth. XRD shows improved stoichiometric TiO2 clusters and preferred anatase phase. Intensity of ZnO PL spectrum has temperature dependence from 10K to 300K. ZnO OA produces red-shifted PL peak, and there are no below-bandgap PL peaks. TiO has room temperature PL with UV peak ˜388 nm and visible peak ˜426 nm. ZnO OA nanoclusters show narrower, red shifted peak by ˜0.07eV compared to as deposited ZnO nanoclusters. This indicates increased average grain size and improved size homogeneity after annealing. This is confirmed by Raman spectra showing blue-shifted and narrower peak of the A1 (LO) phonon peak in ZnO OA sample. DOE-EPSCoR (DE-FG02-04ER46142) DOE-BES (DE-FG02-07ER46386).

  4. Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress

    NASA Astrophysics Data System (ADS)

    Yun, Ho-Jin; Kim, Young-Su; Jeong, Kwang-Seok; Kim, Yu-Mi; Yang, Seung-dong; Lee, Hi-Deok; Lee, Ga-Won

    2014-01-01

    In this study, we fabricated dual-gate zinc oxide thin film transistors (ZnO TFTs) without additional processes and analyzed their stability characteristics under a negative gate bias stress (NBS) by comparison with conventional bottom-gate structures. The dual-gate device shows superior electrical parameters, such as subthreshold swing (SS) and on/off current ratio. NBS of VGS = -20 V with VDS = 0 was applied, resulting in a negative threshold voltage (Vth) shift. After applying stress for 1000 s, the Vth shift is 0.60 V in a dual-gate ZnO TFT, while the Vth shift is 2.52 V in a bottom-gate ZnO TFT. The stress immunity of the dual-gate device is caused by the change in field distribution in the ZnO channel by adding another gate as the technology computer aided design (TCAD) simulation shows. Additionally, in flicker noise analysis, a lower noise level with a different mechanism is observed in the dual-gate structure. This can be explained by the top side of the ZnO film having a larger crystal and fewer grain boundaries than the bottom side, which is revealed by the enhanced SS and XRD results. Therefore, the improved stability of the dual-gate ZnO TFT is greatly related to the E-field cancellation effect and crystal quality of the ZnO film.

  5. Van der Pauw Hall Measurement on Intended Doped ZnO Films for p-Type Conductivity

    NASA Astrophysics Data System (ADS)

    Guo, Yang; Liu, Yac-Ping; Li, Jun-Qiang; Zhang, Sheng-Li; Mei, Zeng-Xia; Du, Xiao-Long

    2010-06-01

    A Van der Pauw Hall measurement is performed on the intended doped ZnO films (Na doped ZnO) grown by using the molecular beam epitaxial method. All as-grown samples show n-type conductivity, whereas the annealed samples (annealing temperature 900° C) show ambiguous carrier conductivity type (n- and p-type) in the automatic Van der Pauw Hall measurement. A similar result has been observed in Li doped ZnO and in as-doped ZnO films by other groups before. However, by tracing the Hall voltage in the Van der Pauw Hall measurement, it is found that this alternative appearance of both n- and p-type conductivity is not intrinsic behavior of the intended doped ZnO films, but is due to the persistent photoconductivity effect in ZnO. The persistent photoconductivity effect would strongly affect the accurate determination of the carrier conductivity type of a highly resistive intended doped ZnO sample.

  6. Tailoring Energy Bandgap of Al Doped ZnO Thin Films Grown by Vacuum Thermal Evaporation Method.

    PubMed

    Vyas, Sumit; Singh, Shaivalini; Chakrabarti, P

    2015-12-01

    The paper presents the results of our experimental investigation pertaining to tailoring of energy bandgap and other associated characteristics of undoped and Al doped ZnO (AZO) thin film by varying the atomic concentration of Al in ZnO. Thin films of ZnO and ZnO doped with Al (1, 3, and 5 atomic percent (at.%)) were deposited on silicon substrate for structural characterization and on glass substrate for optical characterization. The dependence of structural and optical properties of Al doped ZnO on the atomic concentration of Al added to ZnO has been reported. On the basis of the experimental results an empirical formula has been proposed to calculate the energy bandgap of AZO theoretically in the range of 1 to 5 at.% of Al. The study revealed that AZO films are composed of smaller and larger number of grains as compared to pure ZnO counterpart and density of the grains was found to increase as the Al concentration increased (from 1 to 5 at.%). The transmittance in the visible region was greater than 90% and found to increase with increasing Al concentration up to 5 at.%. The optical bandgap was found to increase initially with increase in atomic concentration of Al concentration up to 3 at.% and decrease thereafter with increasing concentration of Al.

  7. Structure and thermoelectric properties of Al-doped ZnO films prepared by thermal oxidization under high magnetic field

    NASA Astrophysics Data System (ADS)

    Liu, Shiying; Peng, Sunjuan; Ma, Jun; Li, Guojian; Qin, Xuesi; Li, Mengmeng; Wang, Qiang

    2017-04-01

    This paper studies the effects of high magnetic field (HMF) on the structure, optical and thermoelectric properties of the doped ZnO thin films. The results show that both Al dopant and application of HMF can affect the crystal structure, surface morphology, elemental distribution and so on. The particles of the thin films become small and regular by doping Al. The ZnO films oxidized from the Au/Zn bilayer have needle structure. The ZnO films oxidized from the Au/Zn-Al bilayer transform to spherical from hexagonal due to the application of HMF. The transmittance decreases with doping Al because of the opaque of Al element and decreases with the application of HMF due to the dense structure obtained under HMF. Electrical resistivity (ρ) of the ZnO films without Al decreases with increasing measurement temperature (T) and is about 1.5 × 10-3 Ω·m at 210 °C. However, the ρ of the Al-doped ZnO films is less than 10-5 Ω·m. The Seebeck coefficient (S) of the films oxidized from the Au/Zn-Al films reduces with increasing T. The S values oxidized under 0 T and 12 T conditions are 2.439 μV/K and -3.415 μV/K at 210 °C, respectively. Power factor reaches the maximum value (3.198 × 10-4 W/m·K2) at 210 °C for the film oxidized under 12 T condition. These results indicate that the Al dopant and the application of HMF can be used to control structure and thermoelectric properties of doped ZnO films.

  8. Magnetotransmission measurement of ferromagnetism origin in Mn-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Zhang, Li; Yu, Wei; Wu, Shujie; Zhang, Jinchuan; Yang, Lihua; Fu, Guangsheng

    2008-12-01

    Magnetotransmission spectroscopy, the optical absorption measurement using circularly polarized light in the range from far infrared to near ultraviolet, is a direct method to study the energy structure of diluted magnetic semiconductors. In this paper, the magnetotransmission measurement is performed on the ferromagnetic Mn-doped ZnO films. The splitting between two circularly polarized light absorption edge is up to 10 meV under external magnetic field of 0.8 T at room temperature. The splitting is closely follows the magnetization of the films, as measured using Vibrating Sample Magnetometer. The observed ferromagnetic-type splitting of absorption edge is explained by antiferromagnetic p-d exchange interaction.

  9. Surface modification of carbon post arrays by atomic layer deposition of ZnO film.

    PubMed

    Lee, Hyun Ae; Byun, Young-Chul; Singh, Umesh; Cho, Hyoung J; Kim, Hyoungsub

    2011-08-01

    The applicability of atomic layer deposition (ALD) process to the carbon microelectromechanical system technology was studied for a surface modification method of the carbon post electrodes. A conformal coating of the ALD-ZnO film was successfully demonstrated on the carbon post arrays which were fabricated by the traditional photolithography and subsequent two-step pyrolysis. A significant Zn diffusion into the underlying carbon posts was observed during the ALD process. The addition of a sputter-deposited ZnO interfacial layer efficiently blocked the Zn diffusion without altering the microstructure and surface morphology of the ALD-ZnO film.

  10. Effect of doping concentration on the conductivity and optical properties of p-type ZnO thin films

    NASA Astrophysics Data System (ADS)

    Pathak, Trilok Kumar; Kumar, Vinod; Swart, H. C.; Purohit, L. P.

    2016-01-01

    Nitrogen doped ZnO (NZO) thin films were synthesized on glass substrates by the sol-gel and spin coating method. Zinc acetate dihydrates and ammonium acetate were used as precursors for zinc and nitrogen, respectively. X-ray diffraction study showed that the thin films have a hexagonal wurtzite structure corresponding (002) peak for undoped and doped ZnO thin films. The transmittance of the films was above 80% and the band gap of the film varies from 3.21±0.03 eV for undoped and doped ZnO. The minimum resistivity of NZO thin films was obtained as 0.473 Ω cm for the 4 at% of nitrogen (N) doping with a mobility of 1.995 cm2/V s. The NZO thin films showed p-type conductivity at 2 and 3 at% of N doping. The AC conductivity measurements that were carried out in the frequency range 10 kHz to 0.1 MHz showed localized conduction in the NZO thin films. These highly transparent ZnO films can be used as a possible window layer in solar cells.

  11. Confinement effects in ultrathin ZnO polymorph films: Electronic and optical properties

    NASA Astrophysics Data System (ADS)

    Sponza, Lorenzo; Goniakowski, Jacek; Noguera, Claudine

    2016-05-01

    Relying on generalized-gradient and hybrid first-principles simulations, this work provides a complete characterization of the electronic properties of ZnO ultrathin films, cut along the body-centered-tetragonal(010), cubane(100), hexagonal boron nitride(0001), zinc-blende(110), and wurtzite (10 1 ¯0 ) and (0001) orientations. The characteristics of the local densities of states are analyzed in terms of the reduction of the Madelung potential on undercoordinated atoms and surface states/resonances appearing at the top of the valence band and bottom of the conduction band. The gap width in the films is found to be larger than in the corresponding bulks, which is assigned to quantum confinement effects. The components of the high-frequency dielectric constant are determined and the absorption spectra of the films are computed. They display specific features just above the absorption threshold due to transitions from or to the surface resonances. This study provides a first understanding of finite-size effects on the electronic properties of ZnO thin films and a benchmark which is expected to foster experimental characterization of ultrathin films via spectroscopic techniques.

  12. Transparent conductive Al-doped ZnO thin films grown at room temperature

    SciTech Connect

    Wang Yuping; Lu Jianguo; Bie Xun; Gong Li; Li Xiang; Song Da; Zhao Xuyang; Ye Wenyi; Ye Zhizhen

    2011-05-15

    Aluminum-doped ZnO (ZnO:Al, AZO) thin films were prepared on glass substrates by dc reactive magnetron sputtering from a Zn-Al alloy target at room temperature. The effects of the Ar-to-O{sub 2} partial pressure ratios on the structural, electrical, and optical properties of AZO films were studied in detail. AZO films grown using 100:4 to 100:8 Ar-to-O{sub 2} ratio result in acceptable quality films with c-axis orientated crystals, uniform grains, 10{sup -3} {Omega} cm resistivity, greater than 10{sup 20} cm{sup -3} electron concentration, and high transmittance, 90%, in the visible region. The lowest resistivity of 4.11x10{sup -3} {Omega} cm was obtained under the Ar-to-O{sub 2} partial pressure ratio of 100:4. A relatively strong UV emission at {approx}3.26 eV was observed in the room-temperature photoluminescence spectrum. X-ray photoelectron spectroscopy analysis confirmed that Al was introduced into ZnO and substitutes for Zn and doped the film n-type.

  13. A nano-structured ZnO film as diagnostic X-ray sensor

    SciTech Connect

    Valenca, Claudia Patricia Varela; Liborio da Silveira, Matheus Augusto; Macedo, Marcelo Andrade; Pereira dos Santos, Luiz Antonio

    2015-07-01

    Currently some international organizations such as WHO and IAEA have shown concerns about the quality of diagnostic services in clinics and hospitals that use ionizing radiation. In fact, the IAEA recommend that the characteristics of the X-ray beam must be adjusted to obtain the highest quality of the radiographic image with the minimum exposure to the patient. Several types of detectors may be used for monitoring X-ray beams, such as: ionization chamber, photodiode, phototransistor, among others. Recently nano-structured films made of various types of metal oxide materials have been used for various technological applications. Accordingly, the purpose of this paper is to present a sort of device based on a nano-structured zinc oxide (ZnO) to operate as a diagnostic X-ray sensor. By depositing a thin film on the glass substrate some ZnO semiconductor samples were built by sputtering techniques and then mounted in a BNC type connector to perform the electrical characterization. To test the device, we choose a standard X-Ray beam, the RQR9 radiation quality, which is normally used as the tool and condition for calibrating diagnostic X-Ray instruments in the energy range of computed tomography, in accordance with the stated requirements of IEC 61267. A 6430 sub-femto-ammeter, Keithley, was used as electrometer to perform the output readings and simultaneously bias the ZnO sensor. Analysis of the angular dependence and the dose rate were performed to evaluate how the device responds under the RQR9 radiation spectra. Although the results have shown that the ZnO film presents a certain angular dependence, if an angle of incidence of photons is selected, the device displays reproducibility as X-ray sensor and has the feature of radiation hardness unlike other types of semiconductor electronic devices typically used as an X-ray detector. (authors)

  14. Flexible ZnO transparent thin-film transistors by a solution-based process at various solution concentrations

    NASA Astrophysics Data System (ADS)

    Lee, C. Y.; Lin, M. Y.; Wu, W. H.; Wang, J. Y.; Chou, Y.; Su, W. F.; Chen, Y. F.; Lin, C. F.

    2010-10-01

    We report solution-processed ZnO thin-film transistors (TFTs) on a flexible substrate, using polymethylmethacrylate (PMMA) as a dielectric layer. To improve the compatibility between the ZnO active layer and the PMMA dielectric, an O2-plasma treatment has been applied to the PMMA dielectric. The structural and electrical characteristics of the ZnO-TFTs, which have different channel morphologies produced by various concentrations of the ZnO solution, were investigated. The ZnO trap centers of the ZnO-TFTs were decreased as the concentration of the ZnO solution increased. The ZnO-TFT with the optimized channel morphology exhibited a high field-effect mobility of 7.53 cm2 V-1 s-1.

  15. Thin-film copper indium gallium selenide solar cell based on low-temperature all-printing process.

    PubMed

    Singh, Manjeet; Jiu, Jinting; Sugahara, Tohru; Suganuma, Katsuaki

    2014-09-24

    In the solar cell field, development of simple, low-cost, and low-temperature fabrication processes has become an important trend for energy-saving and environmental issues. Copper indium gallium selenide (CIGS) solar cells have attracted much attention due to the high absorption coefficient, tunable band gap energy, and high efficiency. However, vacuum and high-temperature processing in fabrication of solar cells have limited the applications. There is a strong need to develop simple and scalable methods. In this work, a CIGS solar cell based on all printing steps and low-temperature annealing is developed. CIGS absorber thin film is deposited by using dodecylamine-stabilized CIGS nanoparticle ink followed by printing buffer layer. Silver nanowire (AgNW) ink and sol-gel-derived ZnO precursor solution are used to prepare a highly conductive window layer ZnO/[AgNW/ZnO] electrode with a printing method that achieves 16 Ω/sq sheet resistance and 94% transparency. A CIGS solar cell based on all printing processes exhibits efficiency of 1.6% with open circuit voltage of 0.48 V, short circuit current density of 9.7 mA/cm(2), and fill factor of 0.34 for 200 nm thick CIGS film, fabricated under ambient conditions and annealed at 250 °C.

  16. Velocity surface measurements for ZnO films over /001/-cut GaAs

    NASA Technical Reports Server (NTRS)

    Kim, Yoonkee; Hunt, William D.; Liu, Yongsheng; Jen, Cheng-Kuei

    1994-01-01

    A potential application for a piezoelectic film deposited on a GaAs substrate is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Knowledge of the SAW properties of the filmed structure is critical for the optimum design of such devices. In this article, the measurements of the velocity surface, which directly affects the SAW diffraction, on the bare and metallized ZnO/SiO2 or Si3N4/GaAs /001/-cut samples are reported using two different techniques: (1) knife-edge laser probe, (2) line-focus-beam scanning acoustic microscope. Comparisons, such as measurement accuracy and tradeoffs, between the former (dry) and the latter (wet) method are given. It is found that near the group of zone axes (110) propagation direction the autocollimating SAW property of the bare GaAs changes into a noncollimating one for the layered structure, but a reversed phenomenon exists near the group of zone axes (100) direction. The passivation layer of SiO2 or Si3N4 (less than 0.2 micrometer thick) and the metallization layer change the relative velocity but do not significantly affect the velocity surface. On the other hand, the passivation layer reduces the propagation loss by 0.5-1.3 dB/microseconds at 240 MHz depending upon the ZnO film thickness. Our SAW propagation measurements agree well with theorectical calculations. We have also obtained the anisotropy factors for samples with ZnO films of 1.6, 2.8, and 4.0 micrometer thickness. Comparisons concerning the piezoelectric coupling and acoustic loss between dc triode and rf magnetron sputtered ZnO films are provided.

  17. The electrical stability of In-doped ZnO thin films deposited by RF sputtering

    NASA Astrophysics Data System (ADS)

    Sun, Hui; Jen, Shien-Uang; Chen, Sheng-Chi; Ye, Shiau-Shiang; Wang, Xin

    2017-02-01

    The electrical stability of transparent conductive oxides is an important criterion for evaluating their performance, especially when they are employed at elevated temperatures or in long-term operation. In this work, indium-doped ZnO thin films with various doping concentrations were prepared by RF sputtering. The electrical properties, electrical thermal stability, and time stability of films with differing indium contents were investigated. The results showed that the degradation of the films’ conductivity is primarily attributable to the reduction in oxygen vacancies at high temperatures under oxygenated conditions. The aggregation of indium atoms, which cannot replace Zn3+ cations at temperatures above 200 °C, can improve the carrier concentration. Further reaction with oxygen degraded the performance of the films due to the formation of insulating oxides. Long-term analysis showed the IZO films to have quite stable electrical properties. Their conductivity remained almost unchanged after two months at room temperature under normal atmospheric conditions.

  18. Photocontrollable water permeation on the micro/nanoscale hierarchical structured ZnO mesh films.

    PubMed

    Tian, Dongliang; Zhang, Xiaofang; Zhai, Jin; Jiang, Lei

    2011-04-05

    Most research of responsive surfaces mainly focus on the wettability transition on different solid substrate surfaces, but the dynamic properties of the micro/nanostructure-enhanced responsive wettability on microscale pore arrays are lacking and still remain a challenge. Here we report the photocontrollable water permeation on micro/nanoscale hierarchical structured ZnO-coated stainless steel mesh films. Especially, for aligned ZnO nanorod array-coated stainless steel mesh film, the film shows good water permeability under irradiation, while it is impermeable to water after dark storage. A detailed investigation indicates that the special nanostructure and the appropriate size of the microscale mesh pores play a crucial role in the excellent controllability over water permeation. The excellent controllability of water permeation on this film is promising in various important applications such as filtration, microreactor, and micro/nano fluidic devices. This work may provide interesting insight into the design of novel functional devices that are relevant to surface wettability.

  19. The crystalline structure of copper phthalocyanine films on ZnO(1100).

    PubMed

    Cruickshank, Amy C; Dotzler, Christian J; Din, Salahud; Heutz, Sandrine; Toney, Michael F; Ryan, Mary P

    2012-09-05

    The structure of copper phthalocyanine (CuPc) thin films (5-100 nm) deposited on single-crystal ZnO(1100) substrates by organic molecular beam deposition was determined from grazing-incidence X-ray diffraction reciprocal space maps. The crystal structure was identified as the metastable polymorph α-CuPc, but the molecular stacking was found to vary depending on the film thickness: for thin films, a herringbone arrangement was observed, whereas for films thicker than 10 nm, coexistence of both the herringbone and brickstone arrangements was found. We propose a modified structure for the herringbone phase with a larger monoclinic β angle, which leads to intrastack Cu-Cu distances closer to those in the brickstone phase. This structural basis enables an understanding of the functional properties (e.g., light absorption and charge transport) of (opto)electronic devices fabricated from CuPc/ZnO hybrid systems.

  20. Structural and nonlinear optical behavior of Ag-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Tan, Ming-Yue; Yao, Cheng-Bao; Yan, Xiao-Yan; Li, Jin; Qu, Shu-Yang; Hu, Jun-Yan; Sun, Wen-Jun; Li, Qiang-Hua; Yang, Shou-Bin

    2016-01-01

    We present the structural and nonlinear optical behavior of Ag-doped ZnO (AZO) films prepared by magnetron sputtering. The structural of AZO films are systematically investigated by X-ray diffraction (XRD) and scanning electronic microscopy (SEM), respectively. The results show that AZO films can still retain a wurtzite structure, although the c-axis as preferred orientation is decreased by Ag doping. As the amounts of the Ag dopant were increased, the crystallinity as well as the absorptivity and optical band gap were increased. Moreover, the nonlinear optical characterized of the AZO films was studied using Z-scan technique. These samples show self-defocusing nonlinearity and good nonlinear absorption behavior which increases with increasing Ag volume fraction. AZO is a potential nanocomposite material for the development of nonlinear optical devices with a relatively small limiting threshold.

  1. Annealing induced reorientation of crystallites in Sn doped ZnO films

    NASA Astrophysics Data System (ADS)

    Ravichandran, K.; Vasanthi, M.; Thirumurugan, K.; Sakthivel, B.; Karthika, K.

    2014-11-01

    Tin doped ZnO thin films were prepared by employing a simplified spray pyrolysis technique using a perfume atomizer and subsequently annealed under different temperatures from 350 °C to 500 °C in steps of 50 °C. The structural, optical, electrical, photoluminescence and surface morphological properties of the as-deposited films were studied and compared with that of the annealed films. The X-ray diffraction studies showed that as-deposited film exhibits preferential orientation along the (0 0 2) plane and it changes in favour of (1 0 0) plane after annealing. The increase in crystallite size due to annealing is explained on the basis of Ostwald ripening effect. It is found that the optical transmittance and band gap increases with increase in annealing temperature. A slight decrease in resistivity caused by annealing is discussed in correlation with annealing induced defect modifications and surface morphology.

  2. Synthesis and characterization of porous structured ZnO thin film for dye sensitized solar cell applications

    NASA Astrophysics Data System (ADS)

    Marimuthu, T.; Anandhan, N.; Mummoorthi, M.; Dharuman, V.

    2016-05-01

    Zinc oxide (ZnO) and zinc oxide/eosin yellow (ZnO/EY) thin films were potentiostatically deposited onto fluorine doped tin oxide (FTO) glass substrate. Effect of eosin yellow dye on structural, morphological and optical properties was studied. X-ray diffraction patterns, micro Raman spectra and photoluminescence (PL) spectra reveal hexagonal wurtzite structure with less atomic defects in 101 plane orientation of the ZnO/EY film. Scanning electron microscopy (SEM) images show flower for ZnO and porous like structure for ZnO/EY thin film, respectively. DSSC was constructed and evaluated by measuring the current density verses voltage curve.

  3. SiNx Charge Trap Nonvolatile Memory Based on ZnO Thin Film Transistor Prepared by Atomic Layer Deposition

    NASA Astrophysics Data System (ADS)

    Kim, E.; Lee, K.; Kim, D.; Parsons, G. N.; Park, K.

    2011-12-01

    We fabricated a nonvolatile thin film transistor (TFT) memory with SiNx charge traps using a ZnO thin film as an active channel layer. The thin film of ZnO was deposited by using atomic layer deposition process at TALD = 125 °C. The ZnO films were investigated by X-ray diffraction and X-ray photoemission measurements. The electrical measurements of the nonvolatile TFT memory showed a field-effect mobility of 2.95 cm2 V-1 s-1, a threshold voltage of -7.24 V, a subthreshold swing of 1.7 V/dec, and an on/off ratio of 3.4×105. From the C-V measurement, the memory window of 2 V was obtained.

  4. Real structure of the ZnO epitaxial films on (0001) leucosapphire substrates coated by ultrathin gold layers

    SciTech Connect

    Muslimov, A. E. Butashin, A. V.; Kolymagin, A. B.; Vasilyev, A. L.; Kanevsky, V. M.

    2016-01-15

    The real structure of ZnO films formed by magnetron sputtering on (0001) leucosapphire substrates coated by an ultrathin (less than 0.7 nm) Au buffer layer has been studied by high-resolution microscopy. It is shown that modification of the leucosapphire substrate surface by depositing ultrathin Au layers does not lead to the formation of Au clusters at the film–substrate interface but significantly improves the structural quality of ZnO epitaxial films. It is demonstrated that the simplicity and scalability of the technique used to modify the substrate surface in combination with a high (above 2 nm/s) film growth rate under magnetron sputtering make it possible to obtain high-quality (0001) ZnO epitaxial films with an area of 5–6 cm{sup 2}.

  5. Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition

    NASA Astrophysics Data System (ADS)

    Zhai, Chen-Hui; Zhang, Rong-Jun; Chen, Xin; Zheng, Yu-Xiang; Wang, Song-You; Liu, Juan; Dai, Ning; Chen, Liang-Yao

    2016-09-01

    The tuning of structural, optical, and electrical properties of Al-doped ZnO films deposited by atomic layer deposition technique is reported in this work. With the increasing Al doping level, the evolution from (002) to (100) diffraction peaks indicates the change in growth mode of ZnO films. Spectroscopic ellipsometry has been applied to study the thickness, optical constants, and band gap of AZO films. Due to the increasing carrier concentration after Al doping, a blue shift of band gap and absorption edge can be observed, which can be interpreted by Burstein-Moss effect. The carrier concentration and resistivity are found to vary significantly among different doping concentration, and the optimum value is also discussed. The modulations and improvements of properties are important for Al-doped ZnO films to apply as transparent conductor in various applications.

  6. Fabrication and photoelectric properties of Er3+ and Yb3+ co-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Feng, Wei; Wang, Xiangfu; Meng, Lan; Yan, Xiaohong

    2016-01-01

    In this paper, the Er3+ and Yb3+ co-doped ZnO films deposited by a novel thermal decomposition method under different annealing temperature process have been reported. The effects of annealing temperature on the morphology and properties of the films are systematically studied. The resulting spectra demonstrate that the Er3+ and Yb3+ co-doped ZnO films possessed the property of up-conversion, converting IR light into visible light that can be absorbed by amorphous silicon solar cell. After all, inner photoelectric effect of the Er3+ and Yb3+ co-doped ZnO films in the amorphous as a light scattering layer are also found with an infrared 980 nm laser as excitation source.

  7. Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition.

    PubMed

    Zhai, Chen-Hui; Zhang, Rong-Jun; Chen, Xin; Zheng, Yu-Xiang; Wang, Song-You; Liu, Juan; Dai, Ning; Chen, Liang-Yao

    2016-12-01

    The tuning of structural, optical, and electrical properties of Al-doped ZnO films deposited by atomic layer deposition technique is reported in this work. With the increasing Al doping level, the evolution from (002) to (100) diffraction peaks indicates the change in growth mode of ZnO films. Spectroscopic ellipsometry has been applied to study the thickness, optical constants, and band gap of AZO films. Due to the increasing carrier concentration after Al doping, a blue shift of band gap and absorption edge can be observed, which can be interpreted by Burstein-Moss effect. The carrier concentration and resistivity are found to vary significantly among different doping concentration, and the optimum value is also discussed. The modulations and improvements of properties are important for Al-doped ZnO films to apply as transparent conductor in various applications.

  8. The structure, photoluminescence, optical and magnetic properties of ZnO films doped with ferromagnetic impurities

    NASA Astrophysics Data System (ADS)

    Gritskova, E. V.; Mukhamedshina, D. M.; Mit', K. A.; Dolya, N. A.; Abdullin, Kh. A.

    2009-12-01

    In this paper we report on ZnO-CoO thin films grown by sol-gel technology with using different solvent. As precursors zinc acetate dehydrate (Zn(CH3COO)2·2H2O), cobalt acetate tetrahydrate (Co(CH3COO)2·4H2O) as well as manganese chloride (MnCl2) were used. The films grown from solvent with methanol have a highly preferred orientation along the (1 0 0) plane. The films deposited from C=0.5 and 0.7 mol/l solvent with isopropanol and monoethanolamin and in smaller degree the C=0.3 mol/l film consist of disordered crystallites whereas the C=0.1 mol/l film has the intensive (0 0 2) peak, revealing a more obvious [0 0 2] preferred orientation. The all obtained films are highly transparent. The PL of ZnO-CoO films are more intensive in ultra-violet region in comparison the PL of ZnO film. The ESR spectra of ZnO-CoO multilayer films were investigated.

  9. Photocatalytic activities of wet oxidation synthesized ZnO and ZnO-TiO2 thick porous films

    NASA Astrophysics Data System (ADS)

    Chen, Ruiqun; Han, Jie; Yan, Xiaodong; Zou, Chongwen; Bian, Jiming; Alyamani, Ahmed; Gao, Wei

    2011-05-01

    Highly porous zinc oxide (ZnO) film was produced by using reactive magnetron sputtering zinc target followed by wet oxidation. Titanium dioxide (TiO2) was mixed to the porous films by using either TiO2 target magnetron sputter deposition or sol-spin method. The film thickness could reach 50 μm with uniform porosity. On the sputtering prepared ZnO-TiO2 film surface, fine nanorods with small anatase TiO2 nano-clusters on the tips were observed by SEM and TEM, and the titanium (Ti) composition was determined by XPS as 0.37%. The sol-spin treatment could increase the Ti composition to 4.9%, with reduced pore size compared to the untreated ZnO porous film. Photoluminescence measurements showed that the Ti containing porous film has strong ultraviolet-visible light emission. In the photo-catalysis testing, ZnO and ZnO-TiO2 have similar photo-catalysis activity under 365 nm UV irradiation, but under visible light, the photocatalysis activities of ZnO-TiO2 films were twice higher than that of ZnO porous film, implying promising applications of this porous oxide composite for industrial and dairy farm wastewater treatment.

  10. Antibacterial and physical properties of poly(vinyl chloride)-based film coated with ZnO nanoparticles.

    PubMed

    Li, X H; Xing, Y G; Li, W L; Jiang, Y H; Ding, Y L

    2010-06-01

    Nanoparticles of ZnO and their application in coating systems have attracted a great deal of attention in recent years because of its multifunction property, especially antibacterial activity. In this study, antibacterial and physical properties of poly(vinyl chloride) (PVC) based film coated with ZnO nanoparticles were investigated. It was found that the antibacterial action should be attributed to the killing effect property of ZnO nanoparticles. The ZnO-coated films treated by shaking for 10 h exhibited a similar high antibacterial activity against Escherichia coli and Staphylococcus aureus as the untreated ZnO-coated films. This result indicated that the ZnO nanoparticles adhered very well to the plastic film. The antibacterial activity of the ZnO-coated film to inactivate E. coli or S. aureus was improved by UV irradiation. The analysis of physical properties of the ZnO-coated films revealed that the nano-ZnO particles showed less effects on the tensile strength and elongation at break of the film. The ultraviolet (UV) light fastness of the ZnO-coated PVC film was improved, which may be attributed to the absorption of ZnO nanoparticles against UV light. Water vapor transmission of the ZnO-coated film decreased from 128 to 85 g/m(2) · 24 h, whereas the thickness of film increased from 6.0 μm with increasing the amount of nano-ZnO particles coated from 0 to 187.5 μg/cm(2). This research revealed that the PVC film coated with nano-ZnO particles has a good potential to be used as an active coating system for food packaging.

  11. Pulsed laser deposition of ZnO thin films decorated with Au and Pd nanoparticles with enhanced acetone sensing performance

    NASA Astrophysics Data System (ADS)

    Alexiadou, M.; Kandyla, M.; Mousdis, G.; Kompitsas, M.

    2017-04-01

    We fabricate and compare nanocomposite thin-film ZnO chemoresistive acetone sensors with gold or palladium nanoparticles on the surface, at low operating temperatures. The sensors are fabricated by pulsed laser deposition and operate in the temperature range 159-200 °C. The ZnO films are polycrystalline, crystallizing mainly at the (002) and (101) orientations of the hexagonal phase. The nanocomposite ZnO:Au and ZnO:Pd sensors have a lower detection limit and show a response enhancement factor between 2 and 7, compared with pure ZnO sensors. The ZnO:Pd sensor performs better than the ZnO:Au sensor. The ZnO:Pd sensor sensitivity increases with the amount of palladium on the surface, while it remains roughly unchanged with the ZnO thickness. The lowest acetone concentration we detect is 26 ppm for the operating temperature of 200 °C.

  12. Photocatalytic degradation of toluene using sprayed N-doped ZnO thin films in aqueous suspension.

    PubMed

    Shinde, S S; Bhosale, C H; Rajpure, K Y

    2012-08-01

    Thin films of N-doped ZnO are synthesized via spray pyrolysis technique in aqueous medium using zinc acetate and ammonium acetate as precursors. Influence of N doping onto photochemical, structural, morphological, optical and thermal properties have been investigated. Structural analysis depicts hexagonal (wurtzite) crystal structure. The effect of N doping on the photocatalytic activity of N-doped ZnO in the degradation of toluene is studied and results are compared with pure ZnO. The results show that the rate of degradation of toluene over N-doped ZnO is higher as compared to that of pure ZnO and increases with increasing N doping up to 10 at.% and then decreases. The enhancement of photocatalytic activity of N-doped ZnO thin films is mainly due to their capability for reducing the electron hole pair recombination. The photocatalytic mineralization of toluene in aqueous solution has been studied by measuring COD and TOC. Possible reaction mechanism pathways during toluene degradation over N-doped ZnO has been proposed.

  13. Nitrogen [N]-incorporated ZnO piezoelectric thin films and their application for ultra-small film bulk acoustic wave resonator device fabrication

    SciTech Connect

    Lee, Eunju; Zhang Ruirui; Yoon, Giwan

    2011-10-01

    Nitrogen [N]-incorporated ZnO films with columnar grains of a preferred c-axis orientation were deposited on p-Si (100) wafers, using an RF magnetron sputter deposition technique. For the N incorporation into the ZnO films, an N{sub 2}O gas was used as a doping source and also various process conditions such as N{sub 2}O gas fraction and RF power were applied. Besides, some of the ZnO films were treated with the post annealing process. And then, the micro-structural characteristics of the N-incorporated ZnO films were investigated by a scanning electron microscope, an X-ray diffractometer, and an atomic force microscope techniques. Finally, employing the N-incorporated ZnO films, the solidly mounted resonator-type film bulk acoustic wave resonator devices were fabricated and their resonance characteristics were extracted. As a result, an excellent return loss (S{sub 11}) of- 63 dB was observed at{approx} 0.6 GHz, better than ever reported.

  14. Structural and optical characteristics of the hexagonal ZnO films grown on cubic MgO (001) substrates.

    PubMed

    Shen, Xiangqian; Zhou, Hua; Li, Yaping; Kang, Junyong; Zheng, Jin-Cheng; Ke, Shanming; Wang, Qingkang; Wang, Hui-Qiong

    2016-11-01

    In this Letter, we report on the structural and optical characteristics of ZnO films with a wurtzite structure grown on MgO (001) substrates with cubic structures. The ZnO films were prepared through the molecular beam epitaxy method, and growth orientation transformation from [0001] to [10-10] direction was observed with the change of growth temperature and thickness. The x-ray diffraction pole figures and in situ RHEED patterns demonstrated that the rotational relationship among grains within the ZnO films appeared in a typical two-fold rotation of about 30° for the [0001] growth orientation and four-fold rotation of about 30° or 60° for the [10-10] growth orientation, respectively. Last, we investigated their optical properties through measuring the transmission and photoluminescence spectra of the ZnO films, which showed the bulk-like bandgap feature of the ZnO films in spite of the existing growth orientation transformation.

  15. Effect of self-organization, defects, impurities, and autocatalytic processes on the parameters of ZnO films and nanorods

    SciTech Connect

    Mezdrogina, M. M. Eremenko, M. V.; Levitskii, V. S.; Petrov, V. N.; Terukov, E. I.; Kaidashev, E. M.; Langusov, N. V.

    2015-11-15

    The effects of the parameters of ZnO-film deposition onto different substrates using the method of ac magnetron sputtering in a gas mixture of argon and oxygen hare studied. The phenomenon of self-organization is observed, which leads to invariability of the surface morphology of the ZnO films upon a variation in the substrate materials and deposition parameters. The parameters of the macro- and micro-photoluminescence spectra of the films differ insignificantly from the parameters of the photoluminescence spectra of bulk ZnO crystals obtained by the method of hydrothermal growth. The presence of intense emission with a narrow full-width at half-maximum (FWHM) in different regions of the spectrum allows ZnO films obtained by magnetron sputtering doped with rare-earth metal impurities (REIs) to be considered as a promising material for the creation of optoelectronic devices working in a broad spectral range. The possibility of the implementation of magnetic ordering upon legierung with REIs significantly broadens the functional possibilities of ZnO films. The parameters of the photoluminescence spectra of ZnO nanorods are determined by their geometrical parameters and by the concentration and type of the impurities introduced.

  16. Low temperature deposition of ZnO semiconductor thin films on a PEN substrate by a solution process

    NASA Astrophysics Data System (ADS)

    Tsay, Chien-Yie; Wu, Pei-Wen

    2013-07-01

    Low-temperature processed ZnO semiconductor films were deposited onto polyethylene naphthalate (PEN) plastic substrates by a spin coating technique using ZnO nanoparticle (NP) dispersion. The ZnO nanoparticles (NPs) were synthesized by the hydrothermal method, and solution processable dispersion was used to disperse the ZnO NPs in a mixed aqueous solution with a polyvinylpyrrolidone (PVP) dispersant agent. The effects of annealing temperature (from 150°C to 250°C) on the electrical properties of glass/ZnO film samples are reported. The optimized annealing condition (200°C) was applied for ZnO film deposited on a PEN substrate. Comparative electrical properties of the PEN/ZnO film samples before and after bending tests are also presented. Experimental results show that the electrical resistivity of the PEN/ZnO film sample was 1.91 × 104 Ω cm with a Hall mobility of 45.9 cm2/Vs. After bending tests, the electrical resistivity was raised to 1.26 × 105 Ω cm and the Hall mobility was reduced to 31.0 cm2/Vs.

  17. Band gaps by design: Tailoring ZnO based semiconductor alloy films

    NASA Astrophysics Data System (ADS)

    Che, Hui

    This dissertation presents the research on the synthesis of ZnO based ternary semiconductor alloy films with tailored band gaps and the studies in their structural and optical properties. MgxZn1-xO alloys expanded the band gaps from 3.20 eV to deeper UV region of 5.67 eV. While ZnSxO1-x reduced the band gaps into the visible region of 2.9 eV. The alloy films were grown via reactive sputtering deposition, which is a cost effective and environment-friendly technique. An analytical method was developed for accurately determining the band gaps of alloys via transmission spectroscopy. The structural inhomogeneity issues in the Mg xZn1-xO alloys were studied via Selective Resonant Raman Scattering. Urbach energy analysis and Raman spectral line width analysis indicated that structural defects and alloy composition fluctuations in the MgxZn1-xO alloy films are the dominant origins of the localized electronic tail states and the Raman line broadening. While the Raman line broadening due to the anharmonicity of the alloys is not significant. The achievement of ZnSxO1-x alloy films with reduced band gaps paved the way for further research on band gap engineering of ZnO in the visible region.

  18. Influence of solution viscosity on hydrothermally grown ZnO thin films for DSSC applications

    NASA Astrophysics Data System (ADS)

    Marimuthu, T.; Anandhan, N.; Thangamuthu, R.; Surya, S.

    2016-10-01

    Zinc oxide (ZnO) nanowire arrays (NWAs) were grown onto zinc oxide-titanium dioxide (ZnO-TiO2) seeded fluorine doped tin oxide (FTO) conductive substrate by hydrothermal technique. X-ray diffraction (XRD) patterns depict that ZnO thin films are preferentially oriented along the (002) plane with hexagonal wurtzite structure. Viscosity measurements reveal that viscosity of the solutions linearly increases as the concentrations of the polyvinyl alcohol (PVA) increase in the growth solution. Field emission scanning electron microscope (FE-SEM) images show that the NWAs are vertically grown to seeded FTO substrate with hexagonal structure, and the growth of NWAs decreases as the concentration of the PVA increases. Stylus profilometer and atomic force microscopic (AFM) studies predict that the thickness and roughness of the films decrease with increasing the PVA concentrations. The NWAs prepared at 0.1% of PVA exhibits a lower transmittance and higher absorbance than that of the other films. The band gap of the optimized films prepared at 0.0 and 0.1% of PVA is found to be 3.270 and 3.268 eV, respectively. The photo to current conversion efficiency of the DSSC based on photoanodes prepared at 0.0 and 0.1% of PVA exhibits about 0.64 and 0.82%, respectively. Electrochemical impedance spectra reveal that the DSSC based on photoanode prepared at 0.1% of PVA has the highest charge transfer recombination resistance.

  19. Investigation of the drain current shift in ZnO thin film transistors

    NASA Astrophysics Data System (ADS)

    Abdel-Motaleb, Ibrahim; Shetty, Neeraj; Leedy, Kevin; Cortez, Rebecca

    2011-01-01

    A ZnO thin film transistor (TFT), with barium strontium titanate (BST) as a gate oxide, has been fabricated and characterized. The ZnO and the BST layers were deposited using pulsed laser deposition. The I-V characteristics were measured, and an upward shift in the drain current was observed when the voltage sweeping was repeated. The reasons for this shift were investigated and it was found that the shift could be attributed to the combination effect of the reduction in the built-in potential of the grain boundaries, the population and depopulation of trap centers in the channel, and the existence of mobile charges in the gate oxide layer.

  20. ZnO buffer layer for metal films on silicon substrates

    DOEpatents

    Ihlefeld, Jon

    2014-09-16

    Dramatic improvements in metallization integrity and electroceramic thin film performance can be achieved by the use of the ZnO buffer layer to minimize interfacial energy between metallization and adhesion layers. In particular, the invention provides a substrate metallization method utilizing a ZnO adhesion layer that has a high work of adhesion, which in turn enables processing under thermal budgets typically reserved for more exotic ceramic, single-crystal, or metal foil substrates. Embodiments of the present invention can be used in a broad range of applications beyond ferroelectric capacitors, including microelectromechanical systems, micro-printed heaters and sensors, and electrochemical energy storage, where integrity of metallized silicon to high temperatures is necessary.

  1. Exciton and core-level electron confinement effects in transparent ZnO thin films

    PubMed Central

    Mosquera, Adolfo A.; Horwat, David; Rashkovskiy, Alexandr; Kovalev, Anatoly; Miska, Patrice; Wainstein, Dmitry; Albella, Jose M.; Endrino, Jose L.

    2013-01-01

    The excitonic light emission of ZnO films have been investigated by means of photoluminescence measurements in ultraviolet-visible region. Exciton confinement effects have been observed in thin ZnO coatings with thickness below 20 nm. This is enhanced by a rise of the intensity and a blue shift of the photoluminescence peak after extraction of the adsorbed species upon annealing in air. It is found experimentally that the free exciton energy (determined by the photoluminescence peak) is inversely proportional to the square of the thickness while core-level binding energy is inversely proportional to the thickness. These findings correlate very well with the theory of kinetic and potential confinements.

  2. The magnetic ordering in high magnetoresistance Mn-doped ZnO thin films

    SciTech Connect

    Venkatesh, S.; Baras, A.; Lee, J. -S.; Roqan, I. S.

    2016-03-24

    Here, we studied the nature of magnetic ordering in Mn-doped ZnO thin films that exhibited ferromagnetism at 300 K and superparamagnetism at 5 K. We directly inter-related the magnetisation and magnetoresistance by invoking the polaronpercolation theory and variable range of hopping conduction below the metal-to-insulator transition. By obtaining a qualitative agreement between these two models, we attribute the ferromagnetism to the s-d exchange-induced spin splitting that was indicated by large positive magnetoresistance (~40 %). Low temperature superparamagnetism was attributed to the localization of carriers and non-interacting polaron clusters. This analysis can assist in understanding the presence or absence of ferromagnetism in doped/un-doped ZnO.

  3. Synthesis of nano ZnO thin film on Al foil by rf glow discharge plasma and its effect on E. coli and P. aeruginosa

    NASA Astrophysics Data System (ADS)

    Panigrahi, Jagannath; Nayak, Bijan B.; Behera, Debadhyan; Subudhi, Umakanta; Acharya, Bhabani S.

    2012-09-01

    Nano ZnO thin films were deposited on thin Al foils by a rf glow discharge plasma method in which sublimed zinc acetate vapor (precursor) reacted with oxygen plasma inside a low-pressure reactor. The films were microstructurally characterized using XRD, TEM, FESEM, optical reflectance and micro-Raman spectroscopy methods. In view of the good scope of ZnO coating in food packaging, the antibacterial activity in the ZnO thin films was studied by exposing the films to E. coli and P. aeruginosa for up to 8 h. Bacterial cell inhibition of up to 98-99 % was observed in the thin films.

  4. Structure and properties of Co-doped ZnO films prepared by thermal oxidization under a high magnetic field.

    PubMed

    Li, Guojian; Wang, Huimin; Wang, Qiang; Zhao, Yue; Wang, Zhen; Du, Jiaojiao; Ma, Yonghui

    2015-01-01

    The effect of a high magnetic field applied during oxidation on the structure, optical transmittance, resistivity, and magnetism of cobalt (Co)-doped zinc oxide (ZnO) thin films prepared by oxidizing evaporated Zn/Co bilayer thin films in open air was studied. The relationship between the structure and properties of films oxidized with and without an applied magnetic field was analyzed. The results show that the high magnetic field obviously changed the structure and properties of the Co-doped ZnO films. The Lorentz force of the high magnetic field suppressed the oxidation growth on nanowhiskers. As a result, ZnO nanowires were formed without a magnetic field, whereas polyhedral particles formed under a 6 T magnetic field. This morphology variation from dendrite to polyhedron caused the transmittance below 1,200 nm of the film oxidized under a magnetic field of 6 T to be much lower than that of the film oxidized without a magnetic field. X-ray photoemission spectroscopy indicated that the high magnetic field suppressed Co substitution in the ZnO lattice, increased the concentration of oxygen vacancies, and changed the chemical state of Co. The increased concentration of oxygen vacancies affected the temperature dependence of the resistivity of the film oxidized under a magnetic field of 6 T compared with that of the film oxidized without a magnetic field. The changes of oxygen vacancy concentration and Co state caused by the application of the high magnetic field also increase the ferromagnetism of the film at room temperature. All of these results indicate that a high magnetic field is an effective tool to modify the structure and properties of ZnO thin films.

  5. Structural, spectroscopic and electrical studies of nanostructured porous ZnO thin films prepared by pulsed laser deposition.

    PubMed

    Vinodkumar, R; Navas, I; Porsezian, K; Ganesan, V; Unnikrishnan, N V; Mahadevan Pillai, V P

    2014-01-24

    ZnO thin films are grown on quartz substrates at various substrate temperatures (ranging from 573 to 973 K) under an oxygen ambience of 0.02 mbar by using pulsed laser ablation. Influence of substrate temperature on the structural, morphological, optical and electrical properties of the ZnO thin films are investigated. The XRD and micro-Raman spectra reveal the presence of hexagonal wurtzite structure of ZnO with preferred orientation (002). The particle size is calculated using Debye-Scherer equation and the average size of the crystallites are found to be in the range 17-29 nm. The AFM study reveals that the surface morphology of the film depends strongly on the substrate temperature. UV-Visible transmittance spectra show highly transparent nature of the films in visible region. The calculated optical band gap energy is found to be decrease with increase in substrate temperatures. The complex dielectric constant, the loss factor and the distribution of the volume and surface energy loss of the ZnO thin films prepared at different substrate temperatures are calculated. All the films are found to be highly porous in nature. The PL spectra show very strong emission in the blue region for all the films. The dc electrical resistivity of the film decreases with increase in substrate temperature. The temperature dependent electrical measurements done on the film prepared at substrate temperature 573 K reveals that the electric conduction is thermally activated and the activation energy is found to be 0.03911 eV which is less than the reported values for ZnO films.

  6. Growth-temperature-dependent optical and acetone detection properties of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Shewale, P. S.; Yu, Y. S.

    2015-07-01

    Zinc oxide (ZnO) thin films were prepared onto glass substrates at moderately low growth temperature by two-stage spray pyrolysis technique. The effects of growth temperature on structural, optical and acetone detection properties were investigated with X-ray diffractometry, a UV-visible spectrophotometer, photoluminescence (PL) spectroscopy and a homemade gas sensor testing unit, respectively. All the films are polycrystalline with a hexagonal wurtzite phase and exhibit a preferential orientation along [002] direction. The film crystallinity is gradually enhanced with an increase in growth temperature. The optical measurements show that all the films are physically highly transparent with a transmittance greater than 82% in the visible range. The band gap of the film is observed to exhibit a slight red shift with an increasing growth temperature. The PL studies on the films show UV/violet PL band at ˜ 395 nm. Among all the films investigated, the film deposited at 250 °C demonstrates a maximum sensitivity of 13% towards 20 ppm of acetone vapors at 300 °C operating temperature. Project supported by the Dong-Eui University Grant (No. 2014AA342).

  7. Effect of toxic gases on humidity sensing property of nanocrystalline ZnO film

    NASA Astrophysics Data System (ADS)

    Dixit, Shobhna; Srivastava, Anchal; Srivastava, Atul; Shukla, R. K.

    2007-12-01

    Humidity sensing property of nanocrystalline ZnO film has been investigated over a range of 5-90RH%. Contrary to more popular electrical approach, a novel optoelectronic sensing method has been used. Performance of the humidity sensor is affected by the presence of toxic gases in atmosphere. To gauge this effect, the humidity sensing properties of the film are studied by exposing it to the environment of H2S, SO2, and CH3OH one by one. The zinc oxide film is deposited using print and fire technology. X-ray diffraction of the film shows polycrystalline structure with average grain size of 33.5nm. The effect of toxic gases on the humidity sensing behavior of the film is explained while studying surface morphology of the film. The least detectable change (LDC) in humidity is evaluated for each case. For unexposed film it is found to be 0.14RH%. The LDC in the case of SO2-exposed film is recovered back almost completely by heat treatment.

  8. Conductive ZnO:Zn Composites for High-Rate Sputtering Deposition of ZnO Thin Films

    NASA Astrophysics Data System (ADS)

    Zhou, Li Qin; Dubey, Mukul; Simões, Raul; Fan, Qi Hua; Neto, Victor

    2015-02-01

    We report an electrically conductive composite prepared by sintering ZnO and metallic Zn powders. Microstructure analysis combined with electrical conductivity studies indicated that when the proportion of metallic Zn reached a threshold (˜20 wt.%), a metal matrix was formed in accordance with percolation theory. This composite has potential as a sputtering target for deposition of high-quality ZnO. Use of the ZnO:Zn composite completely eliminates target poisoning effects in reactive sputtering of the metal, and enables deposition of thin ZnO films at rates much higher than those obtained by sputtering of pure ZnO ceramic targets. The optical transmittance of the ZnO films prepared by use of this composite is comparable with that of films produced by radio frequency sputtering of pure ZnO ceramic targets. The sputtering characteristics of the conductive ZnO:Zn composite target are reported, and possible mechanisms of the high rate of deposition are also discussed.

  9. Synthesis and characterization of ZnO nanowires by thermal oxidation of Zn thin films at various temperatures.

    PubMed

    Khanlary, Mohammad Reza; Vahedi, Vahid; Reyhani, Ali

    2012-05-02

    In this research high-quality zinc oxide (ZnO) nanowires have been synthesized by thermal oxidation of metallic Zn thin films. Metallic Zn films with thicknesses of 250 nm have been deposited on a glass substrate by the PVD technique. The deposited zinc thin films were oxidized in air at various temperatures ranging between 450 °C to 650 °C. Surface morphology, structural and optical properties of the ZnO nanowires were examined by scanning electron microscope (SEM), X-ray diffraction (XRD), energy dispersive X-ray (EDX) and photoluminescence (PL) measurements. XRD analysis demonstrated that the ZnO nanowires has a wurtzite structure with orientation of (002), and the nanowires prepared at 600 °C has a better crystalline quality than samples prepared at other temperatures. SEM results indicate that by increasing the oxidation temperature, the dimensions of the ZnO nanowires increase. The optimum temperature for synthesizing high density, ZnO nanowires was determined to be 600 °C. EDX results revealed that only Zn and O are present in the samples, indicating a pure ZnO composition. The PL spectra of as-synthesized nanowires exhibited a strong UV emission and a relatively weak green emission.

  10. Double layer structure of ZnO thin films deposited by RF-magnetron sputtering on glass substrate

    NASA Astrophysics Data System (ADS)

    Besleaga, C.; Stan, G. E.; Galca, A. C.; Ion, L.; Antohe, S.

    2012-09-01

    Transparent ZnO films are synthesized by RF-magnetron sputtering (1.78 MHz) onto glass substrates, using a mild-pressed ZnO powder target. The depositions were carried at three inert argon pressures (0.25 Pa, 0.30 Pa, and 0.45 Pa) at two substrate temperatures (100 °C and 400 °C). The role of the sputtering conditions on ZnO thin films nanostructuring, optical properties and morphology is investigated by X-ray diffraction (XRD), X-ray reflectometry (XRR) and Spectroscopic ellipsometry (SE). XRD investigations revealed that ZnO films show a (0 0 l) texture with nanosized crystallites. Right-angle asymmetry of the (0 0 2) diffraction peak is observed. The peak profile analysis using pseudo-Voigt functions unveils a double overlapped peak structure with different coherent zone size values. A double layer structure is evidenced by analyzing the XRR data. Samples prepared at 0.3 Pa at a temperature of 400 °C have a ˜4 nm bottom layer consisting of highly depleted in oxygen ZnO1-x structure, continued by a 53 nm top layer of textured ZnO. Electrical measurements show that the temperature dependence of the conductivity is well described by the Mott variable range hopping (VRH) law. The samples obtained at 400 °C have a significantly lower resistivity.

  11. In situ growth of a ZnO nanowire network within a TiO(2) nanoparticle film for enhanced dye-sensitized solar cell performance.

    PubMed

    Bai, Yang; Yu, Hua; Li, Zhen; Amal, Rose; Lu, Gao Qing Max; Wang, Lianzhou

    2012-11-14

    ZnO nanowire networks featuring excellent charge transport and light scattering properties are grown in situ within TiO(2) films. The resultant TiO(2) /ZnO composites, used as photoanodes, remarkably enhance the overall conversion efficiency of dye-sensitized solar cells (DSSCs) by 26.9%, compared to that of benchmark TiO(2) films.

  12. Effect of surface microstructure and wettability on plasma protein adsorption to ZnO thin films prepared at different RF powers.

    PubMed

    Huang, Zhan-Yun; Chen, Min; Pan, Shi-Rong; Chen, Di-Hu

    2010-10-01

    In this paper, the adsorption behavior of plasma proteins on the surface of ZnO thin films prepared by radio frequency (RF) sputtering under different sputtering powers was studied. The microstructures and surface properties of the ZnO thin films were investigated by x-ray diffraction (XRD), scanning electron microscopy (SEM), UV-visible optical absorption spectroscopy and contact angle techniques. The results show that the ZnO thin films have better orientation of the (0 0 2) peak with increasing RF power, especially at around 160 W, and the optical band gap of the ZnO films varies from 3.2 to 3.4 eV. The contact angle test carried out by the sessile drop technique denoted a hydrophobic surface of the ZnO films, and the surface energy and adhesive work of the ZnO thin films decreased with increasing sputtering power. The amounts of human fibrinogen (HFG) and human serum albumin (HSA) adsorbing on the ZnO films and reference samples were determined by using enzyme-linked immunosorbent assay (ELISA). The results show that fewer plasma proteins and a smaller HFG/HSA ratio adsorb on the ZnO thin films' surface.

  13. Etching Characteristics and Mechanism of ZnO and Ga-Doped ZnO Thin Films in Inductively Coupled HBr/Ar/CHF3 Plasma

    NASA Astrophysics Data System (ADS)

    Ham, Yong-Hyun; Efremov, Alexander; Lee, Hyun-Woo; Yun, Sun Jin; Min, Nam Ki; Kim, Kwangsoo; Kwon, Kwang-Ho

    2010-08-01

    The etching characteristics and mechanisms of ZnO and Ga-doped ZnO (Ga-ZnO) thin films in a HBr/Ar/CHF3 inductively coupled plasma were investigated. The etching rate of ZnO was measured as a function of the CHF3 mixing ratio in the range of 0-15% in a HBr:Ar = 5:2 plasma at a fixed gas pressure (6 mTorr), input power (700 W), bias power (200 W), and total gas flow rate (50 sccm). The plasma chemistry was analyzed by a combination of the global (zero-dimensional) plasma model, Langmuir probe diagnostics (LP) and quadrupole mass spectrometer (QMS) analysis. It was found that the densities of both HBr and Br are significantly affected by the reactions with the CHF3 dissociation products, while both the ZnO and Ga-ZnO etching rates follow the behavior of the Br atom density and flux. This suggests that the ZnO and Ga-ZnO etching processes are not limited by the ion-surface interaction kinetics and appear in the reaction-rate-limited etching regime.

  14. Influence of water content in mixed solvent on surface morphology, wettability, and photoconductivity of ZnO thin films

    PubMed Central

    2014-01-01

    ZnO thin films have been synthesized by means of a simple hydrothermal method with different solvents. The effect of deionized water content in the mixed solvents on the surface morphology, crystal structure, and optical property has been investigated by scanning electron microscopy, X-ray diffraction, and UV-Vis spectrophotometer. A large number of compact and well-aligned hexagonal ZnO nanorods and the maximal texture coefficient have been observed in the thin film, which is grown in the mixed solvent with x = 40%. A lot of sparse, diagonal, and pointed nanorods can be seen in the ZnO thin film, which is grown in the 40-mL DI water solution. The optical band gap decreases firstly and then increases with the increase of x. Reversible wettability of ZnO thin films were studied by home-made water contact angle apparatus. Reversible transition between hydrophobicity and hydrophilicity may be attributed to the change of surface chemical composition, surface roughness and the proportion of nonpolar planes on the surface of ZnO thin films. Photocurrent response of ZnO thin films grown at different solvents were measured in air. The response duration of the thin film, which is grown in the solvent with x = 40%, exhibits a fast growth in the beginning but cannot approach the saturate current value within 100 s. The theoretical mechanism for the slower growth or decay duration of the photocurrent has been discussed in detail. PMID:25249823

  15. Influence of water content in mixed solvent on surface morphology, wettability, and photoconductivity of ZnO thin films.

    PubMed

    Zhao, Min; Shang, Fengjiao; Lv, Jianguo; Song, Ying; Wang, Feng; Zhou, Zhitao; He, Gang; Zhang, Miao; Song, Xueping; Sun, Zhaoqi; Wei, Yiyong; Chen, Xiaoshuang

    2014-01-01

    ZnO thin films have been synthesized by means of a simple hydrothermal method with different solvents. The effect of deionized water content in the mixed solvents on the surface morphology, crystal structure, and optical property has been investigated by scanning electron microscopy, X-ray diffraction, and UV-Vis spectrophotometer. A large number of compact and well-aligned hexagonal ZnO nanorods and the maximal texture coefficient have been observed in the thin film, which is grown in the mixed solvent with x = 40%. A lot of sparse, diagonal, and pointed nanorods can be seen in the ZnO thin film, which is grown in the 40-mL DI water solution. The optical band gap decreases firstly and then increases with the increase of x. Reversible wettability of ZnO thin films were studied by home-made water contact angle apparatus. Reversible transition between hydrophobicity and hydrophilicity may be attributed to the change of surface chemical composition, surface roughness and the proportion of nonpolar planes on the surface of ZnO thin films. Photocurrent response of ZnO thin films grown at different solvents were measured in air. The response duration of the thin film, which is grown in the solvent with x = 40%, exhibits a fast growth in the beginning but cannot approach the saturate current value within 100 s. The theoretical mechanism for the slower growth or decay duration of the photocurrent has been discussed in detail.

  16. EXAFS and XANES investigation of (Li, Ni) codoped ZnO thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Mino, Lorenzo; Gianolio, Diego; Bardelli, Fabrizio; Prestipino, Carmelo; Senthil Kumar, E.; Bellarmine, F.; Ramanjaneyulu, M.; Lamberti, Carlo; Ramachandra Rao, M. S.

    2013-09-01

    Ni doped, Li doped and (Li, Ni) codoped ZnO thin films were successfully grown using a pulsed laser deposition technique. Undoped and doped ZnO thin films were investigated using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near edge spectroscopy (XANES). Preliminary investigations on the Zn K-edge of the undoped and doped ZnO thin films revealed that doping has not influenced the average Zn-Zn bond length and Debye-Waller factor. This shows that both Ni and Li doping do not appreciably affect the average local environment of Zn. All the doped ZnO thin films exhibited more than 50% of substitutional Ni, with a maximum of 77% for 2% Ni and 2% Li doped ZnO thin film. The contribution of Ni metal to the EXAFS signal clearly reveals the presence of Ni clusters. The Ni-Ni distance in the Ni0 nanoclusters, which are formed in the film, is shorter with respect to the reference Ni metal foil and the Debye-Waller factor is higher. Both facts perfectly reflect what is expected for metal nanoparticles. At the highest doping concentration (5%), the presence of Li favors the growth of a secondary NiO phase. Indeed, 2% Ni and 5% Li doped ZnO thin film shows %Nisub = 75 ± 11, %Nimet = 10 ± 8, %NiO = 15 ± 8. XANES studies further confirm that the substitutional Ni is more than 50% in all the samples. These results explain the observed magnetic properties.

  17. Realization of Cu-Doped p-Type ZnO Thin Films by Molecular Beam Epitaxy.

    PubMed

    Suja, Mohammad; Bashar, Sunayna B; Morshed, Muhammad M; Liu, Jianlin

    2015-04-29

    Cu-doped p-type ZnO films are grown on c-sapphire substrates by plasma-assisted molecular beam epitaxy. Photoluminescence (PL) experiments reveal a shallow acceptor state at 0.15 eV above the valence band edge. Hall effect results indicate that a growth condition window is found for the formation of p-type ZnO thin films, and the best conductivity is achieved with a high hole concentration of 1.54 × 10(18) cm(-3), a low resistivity of 0.6 Ω cm, and a moderate mobility of 6.65 cm(2) V(-1) s(-1) at room temperature. Metal oxide semiconductor capacitor devices have been fabricated on the Cu-doped ZnO films, and the characteristics of capacitance-voltage measurements demonstrate that the Cu-doped ZnO thin films under proper growth conditions are p-type. Seebeck measurements on these Cu-doped ZnO samples lead to positive Seebeck coefficients and further confirm the p-type conductivity. Other measurements such as X-ray diffraction, X-ray photoelectron, Raman, and absorption spectroscopies are also performed to elucidate the structural and optical characteristics of the Cu-doped p-type ZnO films. The p-type conductivity is explained to originate from Cu substitution of Zn with a valency of +1 state. However, all p-type samples are converted to n-type over time, which is mostly due to the carrier compensation from extrinsic defects of ZnO.

  18. Spectroscopic characterization of the plasmas formed during the deposition of ZnO and Al-doped ZnO films by plasma-assisted pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Liang, Peipei; Cai, Hua; Yang, Xu; Li, Hui; Zhang, Wu; Xu, Ning; Sun, Jian; Wu, Jiada

    2016-11-01

    An oxygen-zinc plasma and an oxygen-zinc-aluminum plasma are formed by pulsed laser ablation of a Zn target or pulsed laser co-ablation of a Zn target and an Al target in an electron cyclotron resonance (ECR) discharge-generated oxygen plasma for the deposition of ZnO and Al-doped ZnO (AZO) films. The plasmas are characterized spectroscopically by time-integrated and time-resolved optical emission spectroscopy. Both the oxygen-zinc plasma and the oxygen-zinc-aluminum plasma contain excited species originally present in the working O2 gas and energetic species ablated from the targets. The optical emission of the oxygen-zinc-aluminum plasma is abundant in the emission bands of oxygen molecular ions and the emission lines of mono-atomic oxygen, zinc and aluminum atoms and atomic ions. The time-integrated spectra as well as the time-resolved spectra of the plasma emission indicate that the oxygen species in the ECR oxygen plasma experience additional excitation by the expanding ablation plumes, and the ablated species are excited frequently when traveling accompanying the plume expansion in the oxygen plasma, making the formed plasma highly excited and very reactive, which plays an important role in the reactive growth of ZnO matrix and the in-situ doping of Al into the growing ZnO matrix. The deposited ZnO and AZO films were evaluated for composition analysis by energy dispersive X-ray spectroscopy, structure characterization by X-ray diffraction and optical transmission measurement. The deposited ZnO is slightly rich in O. The Al concentration of the AZO films can be controlled and varied simply by changing the repetition rate of the laser used for Al target ablation. Both the ZnO and the AZO films are featured with hexagonal wurtzite crystal structure and exhibit high optical transparency in a wide spectral region. Al doping results in an improvement in the ultraviolet transparency, a blue shift in the absorption edge and a widening of the band gap.

  19. Effect of In doping on the properties and antibacterial activity of ZnO films prepared by spray pyrolysis.

    PubMed

    Manoharan, C; Pavithra, G; Dhanapandian, S; Dhamodharan, P

    2015-01-01

    Pure and In-doped ZnO thin films were deposited onto glass substrates by spray pyrolysis technique. XRD results showed that all films were polycrystalline in nature with the wurzite structure. A change in preferential orientation from (002) to (101) plane was observed with increase in content of Indium. A reduce in crystallite size was observed with increase of In content. The small sized grains with the porous nature of the film was observed from SEM analysis. AFM study depicted polycrystalline nature and uniformly distributed grains with small pores in the doped film. A decrease in band gap was noticed with increase in In content. The absence of green emission in PL spectra indicated the decreased oxygen defects. The decrease in the resistivity with increase of Hall mobility was noted for the doped film. A better antibacterial activity was observed against Staphylococcus aureus by doped ZnO thin film.

  20. Synthesis of ZnO nanowires for thin film network transistors

    NASA Astrophysics Data System (ADS)

    Dalal, S. H.; Unalan, H. E.; Zhang, Y.; Hiralal, Pritesh; Gangloff, L.; Flewitt, Andrew J.; Amaratunga, Gehan A. J.; Milne, William I.

    2008-08-01

    Zinc oxide nanowire networks are attractive as alternatives to organic and amorphous semiconductors due to their wide bandgap, flexibility and transparency. We demonstrate the fabrication of thin film transistors (TFT)s which utilize ZnO nanowires as the semiconducting channel. These thin film transistors can be transparent and flexible and processed at low temperatures on to a variety of substrates. The nanowire networks are created using a simple contact transfer method that is easily scalable. Apparent nanowire network mobility values can be as high as 3.8 cm2/Vs (effective thin film mobility: 0.03 cm2/Vs) in devices with 20μm channel lengths and ON/OFF ratios of up to 104.

  1. Enhanced stimulated emission in ZnO thin films using microdisk top-down structuring

    SciTech Connect

    Nomenyo, K.; Kostcheev, S.; Lérondel, G.; Gadallah, A.-S.; Rogers, D. J.

    2014-05-05

    Microdisks were fabricated in zinc oxide (ZnO) thin films using a top-down approach combining electron beam lithography and reactive ion etching. These microdisk structured thin films exhibit a stimulated surface emission between 3 and 7 times higher than that from a reference film depending on the excitation power density. Emission peak narrowing, reduction in lasing threshold and blue-shifting of the emission wavelength were observed along with enhancement in the emitted intensity. Results indicate that this enhancement is due to an increase in the internal quantum efficiency combined with an amplification of the stimulated emission. An analysis in terms of waveguiding is presented in order to explain these effects. These results demonstrate that very significant gains in emission can be obtained through conventional microstructuration without the need for more onerous top-down nanostructuration techniques.

  2. Annealing temperature dependency of ZnO thin films memristive behavior

    NASA Astrophysics Data System (ADS)

    Shaari, N. A. A.; Kasim, S. M. M.; Rusop, M.; Herman, S. H.

    2016-07-01

    The work focuses on the effect of different annealing temperature on the ZnO-based memristive device. Zinc oxide was deposited on the ITO substrate by sol-gel spincoating technique. The deposited ZnO thin films were then annealed from 50°C to 450°C in a furnace for 60 minutes each. The electrodes Platinum (Pt) were sputtered by using JEOL JFC-1600 Auto Fine Coater. The thin film thicknesses were measured by Veeco Dektak 150 Surface Profiler. The thickness of the thin film annealed at 350°C is the thinnest, which is 54.78nm and from the electrical characterization it also shown the switching characteristic behavior. The surface morphology and topology to examine the existence of nanoparticles

  3. Compositional and Structural Study of Gd Implanted ZnO Films

    SciTech Connect

    Murmu, Peter P.; Kennedy, John V.; Markwitz, Andreas; Ruck, Ben J.

    2009-07-23

    We report a compositional and structural study of ZnO films implanted with 30 keV Gd ions. The depth profile of the implanted ions, measured by Rutherford backscattering spectrometry, matches predictions of DYNAMIC-TRIM calculations. However, after annealing at temperatures above 550 deg. C the Gd ions are observed to migrate towards the bulk, and at the same time atomic force microscope images of the film surfaces show significant roughening. Raman spectroscopy shows that the annealed films have a reduced number of crystalline defects. The overall results are useful for developing an implantation-annealing regime to produce well characterized samples to investigate magnetism in the ZnO:Gd system.

  4. Compositional and Structural Study of Gd Implanted ZnO Films

    NASA Astrophysics Data System (ADS)

    Murmu, Peter P.; Kennedy, John V.; Markwitz, Andreas; Ruck, Ben J.

    2009-07-01

    We report a compositional and structural study of ZnO films implanted with 30 keV Gd ions. The depth profile of the implanted ions, measured by Rutherford backscattering spectrometry, matches predictions of DYNAMIC-TRIM calculations. However, after annealing at temperatures above 550° C the Gd ions are observed to migrate towards the bulk, and at the same time atomic force microscope images of the film surfaces show significant roughening. Raman spectroscopy shows that the annealed films have a reduced number of crystalline defects. The overall results are useful for developing an implantation-annealing regime to produce well characterized samples to investigate magnetism in the ZnO:Gd system.

  5. Work function increase of Al-doped ZnO thin films by B+ ion implantation.

    PubMed

    Hong, Sang-Jin; Heo, Gi-Seok; Park, Jong-Woon; Lee, In-Hwan; Choi, Bum-Ho; Lee, Jong-Ho; Park, Se-Yeon; Shin, Dong-Chan

    2007-11-01

    The work function of an Al-doped ZnO (AZO) thin film can be increased via B+ ion implantation from 3.92 eV up to 4.22 eV. The ion implantation has been carried out with the ion dose of 1 x 10(16) cm(-2) and ion energy of 5 keV. The resistance of the B+ implanted AZO films has been a bit raised, while their transmittance is slightly lowered, compared to those of un-implanted AZO films. These behaviors can be explained by the doping profile and the resultant band diagram. It is concluded that the coupling between the B+ ions and oxygen vacancies would be the main reason for an increase in the work function and a change in the other properties. We also address that the work function is more effectively alterable if the defect density of the top transparent conducting oxide layer can be controlled.

  6. Influence of Te and Se doping on ZnO films growth by SILAR method

    NASA Astrophysics Data System (ADS)

    Güney, Harun; Duman, Ćaǧlar

    2016-04-01

    The AIP Successive ionic layer adsorption and reaction (SILAR) is an economic and simple method to growth thin films. In this study, SILAR method is used to growth Selenium (Se) and Tellurium (Te) doped zinc oxide (ZnO) thin films with different doping rates. For characterization of the films X-ray diffraction (XRD), absorbance and scanning electron microscopy (SEM) are used. XRD results are showed well-defined strongly (002) oriented crystal structure for all samples. Also, absorbance measurements show, Te and Se concentration are proportional and inversely proportional with band gap energy, respectively. SEM measurements show that the surface morphology and thickness of the material varied with Se and/or Te and varying concentrations.

  7. Low-energy muon [LEM] study of Zn-phthalocyanine and ZnO thin films

    NASA Astrophysics Data System (ADS)

    Alberto, H. V.; Piroto Duarte, J.; Weidinger, A.; Vilão, R. C.; Gil, J. M.; Ayres de Campos, N.; Fostiropoulos, K.; Prokscha, T.; Suter, A.; Morenzoni, E.

    2009-04-01

    Implantation of low-energy muons in zinc-phthalocyanine (ZnPc) thin-films leads to the formation of muoniated radical states, the fast decaying of the μSR signal at low fields being a clear indication of muonium formation. The formation probability of these paramagnetic states is independent of the implantation depth and amounts, as in the bulk, to approximately 100% of all muons. In these molecular crystals the formation of muonium is a highly local effect and is fairly independent of crystalline structure and defects in the sample. In contrast to that, in vapour-grown ZnO films the paramagnetic signal known from bulk experiments is not observed, even for the deeper implantations. We suggest that in this case muonium is not formed due to the low concentration of free electrons. In these strongly distorted films, electrons are captured at defects and are not available for muonium formation.

  8. Crystalline polarity of ZnO thin films deposited under dc external bias on various substrates

    NASA Astrophysics Data System (ADS)

    Ohsawa, Takeo; Tsunoda, Kei; Dierre, Benjamin; Zellhofer, Caroline; Grachev, Sergey; Montigaud, Hervé; Ishigaki, Takamasa; Ohashi, Naoki

    2017-04-01

    Effects of the nature of substrates, either crystalline or non-crystalline, on the structure and properties of ZnO films deposited by sputtering were investigated. This study focuses mainly on the role of the external electric bias applied to substrates during magnetron sputtering deposition in controlling crystalline polarity, i.e., Zn-face or O-face, and the resulting film properties. It was found that polarity control was achieved on silica and silicon substrates but not on sapphire substrates. The substrate bias did influence the lattice parameters in the structural formation; however, the selection of the substrate type had a significant influence on the defect structures and the film properties.

  9. Substrate temperature effects on the electrical properties of sputtered Al doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Kim, Deok-Kyu; Kim, Hong-Bae

    2015-09-01

    Al doped ZnO (AZO) thin films were deposited on glass substrate by RF magnetron sputtering system. The dependence of structural, electrical, and optical properties on the substrate temperature variations in the range of 0-400 °C was investigated. The structural results reveal that the AZO films are (0 0 2) oriented and at 400 °C a considerable crystallinity enhancement of the films is observed. With increasing the substrate temperature, the resistivity is increased by decreasing of the mobility and carrier concentration. X-ray photoelectron spectroscopy (XPS) results show that the mobility and the carrier concentration are decreased by increasing the surface bonding and decreasing the Al content, respectively. In our case, the increase in substrate temperature suppressed the incorporation of Al atoms together with the decrease of oxygen vacancy. The improvement of Al doping efficiency is a very important factor to obtain better electrical properties at high substrate temperatures.

  10. Temperature dependence of the spin relaxation in highly degenerate ZnO thin films

    SciTech Connect

    Prestgard, M. C.; Siegel, G.; Tiwari, A.; Roundy, R.; Raikh, M.

    2015-02-28

    Zinc oxide is considered a potential candidate for fabricating next-generation transparent spintronic devices. However, before this can be achieved, a thorough scientific understanding of the various spin transport and relaxation processes undergone in this material is essential. In the present paper, we are reporting our investigations into these processes via temperature dependent Hanle experiments. ZnO thin films were deposited on c-axis sapphire substrates using a pulsed laser deposition technique. Careful structural, optical, and electrical characterizations of the films were performed. Temperature dependent non-local Hanle measurements were carried out using an all-electrical scheme for spin injection and detection over the temperature range of 20–300 K. From the Hanle data, spin relaxation time in the films was determined at different temperatures. A detailed analysis of the data showed that the temperature dependence of spin relaxation time follows the linear-in-momentum Dyakonov-Perel mechanism.

  11. Robust room temperature ferromagnetism and band gap tuning in nonmagnetic Mg doped ZnO films

    NASA Astrophysics Data System (ADS)

    Quan, Zhiyong; Liu, Xia; Qi, Yan; Song, Zhilin; Qi, Shifei; Zhou, Guowei; Xu, Xiaohong

    2017-03-01

    Mg doped ZnO films with hexagonal wurtzite structure were deposited on c-cut sapphire Al2O3 substrates by pulsed laser deposition. Both room temperature ferromagnetism and band gap of the films simultaneously tuned by the concentration of oxygen vacancies were performed. Our results further reveal that the singly occupied oxygen vacancies should be responsible for the room temperature ferromagnetism and band gap narrowing. Singly occupied oxygen vacancies having the localized magnetic moments form bound magnetic polarons, which results in a long-range ferromagnetic ordering due to Mg doping. Moreover, band gap narrowing of the films is probably due to the formation of impurity band in the vicinity of valence band, originating from singly occupied oxygen vacancies. These results may build a bridge to understand the relationship between the magnetic and optical properties in oxide semiconductor, and are promising to integrate multiple functions in one system.

  12. Sol-gel synthesis and characterization of undoped and Al-doped ZnO thin films for memristive application

    NASA Astrophysics Data System (ADS)

    Ayana, Dawit G.; Prusakova, Valentina; Collini, Cristian; Nardi, Marco V.; Tatti, Roberta; Bortolotti, Mauro; Lorenzelli, Leandro; Chiappini, Andrea; Chiasera, Alessandro; Ferrari, Maurizio; Lunelli, Lorenzo; Dirè, Sandra

    2016-11-01

    The Sol-gel route is a versatile method to fabricate multi-layer, dense and homogeneous ZnO thin films with a controlled thickness and defects for a memristive application. In this work, sol-gel derived multi-layer undoped and Al-doped ZnO thin films were prepared by a spin-coating technique on SiO2/Ti/Pt and silica glass substrates. The effect of both Al doping and curing conditions on the structural and morphological features of ZnO films was investigated by complementary techniques, including electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy, micro-Raman spectroscopy, and X-ray diffraction analysis. Electrical measurements were performed on SiO2/Ti/Pt/ZnO/Pt(dishes) and SiO2/Ti/Pt/ZnO(Al)/Pt(dishes) fabricated memristive cells and preliminary current-voltage curves were acquired.

  13. Effects of Annealing Temperature on Properties of Ti-Ga–Doped ZnO Films Deposited on Flexible Substrates

    PubMed Central

    Chen, Tao-Hsing; Chen, Ting-You

    2015-01-01

    An investigation is performed into the optical, electrical, and microstructural properties of Ti-Ga–doped ZnO films deposited on polyimide (PI) flexible substrates and then annealed at temperatures of 300 °C, 400 °C, and 450 °C, respectively. The X-ray diffraction (XRD) analysis results show that all of the films have a strong (002) Ga doped ZnO (GZO) preferential orientation. As the annealing temperature is increased to 400 °C, the optical transmittance increases and the electrical resistivity decreases. However, as the temperature is further increased to 450 °C, the transmittance reduces and the resistivity increases due to a carbonization of the PI substrate. Finally, the crystallinity of the ZnO film improves with an increasing annealing temperature only up to 400 °C and is accompanied by a smaller crystallite size and a lower surface roughness.

  14. Investigation on the physical properties of C-doped ZnO thin films deposited by the thermionic vacuum arc

    NASA Astrophysics Data System (ADS)

    Mohammadigharehbagh, Reza; Özen, Soner; Hakan Yudar, H.; Şenay, Volkan; Pat, Suat; Korkmaz, Şadan

    2017-01-01

    The aim of this study is to determine some physical properties of C-doped ZnO coated on a glass substrate by using the thermionic vacuum arc method. The produced C-doped ZnO thin film is characterized by using several analysis techniques. The produced thin film has a cubic crystal structure, high transmittance in the visible region, symmetrical surface distribution, and optical band gap energy of 3.34 eV. According to the XRD analysis of the produced thin film, it is a fullerene (C60)-doped polycrystalline ZnO. Hardness value and Young's modulus value were determined as 8 GPa and 140 GPa, respectively. These physical properties are adequate for future transparent electrode applications.

  15. ZnO double layer film with a novel organic sensitizer as an efficient photoelectrode for dye-sensitized solar cells

    NASA Astrophysics Data System (ADS)

    Lee, Chuan-Pei; Chen, Ping-Wei; Li, Chun-Ting; Huang, Yi-June; Li, Sie-Rong; Chang, Ling-Yu; Chen, Pei-Yu; Lin, Lu-Yin; Vittal, R.; Sun, Shih-Sheng; Lin, Jiang-Jen; Ho, Kuo-Chuan

    2016-09-01

    A novel organic sensitizer, coded CR147, is applied to sensitize a ZnO-based dye-sensitized solar cell (DSSC). The common problem of ZnO dissolution and Zn2+/dye agglomeration, caused by the use of ruthenium-based dyes, is solved by the application of this CR147 dye. The highest power conversion efficiency (η) of 4.77% is achieved for the DSSC using a photoanode with a film of commercial ZnO nanoparticles (Csbnd ZnO) and the CR147 dye, while the η is only 3.41% for the DSSC with the commercial N719 dye. The cell performance with the CR147 dye is further improved by using a photoanode with the double layer ZnO film (D-ZnO), composed of an underlayer with coral-like ZnO nanocrystals and an overlayer with hexagonal club-like ZnO submicrocrystals. The DSSC with the D-ZnO film exhibits an η of 6.89%, which is ca. 45% higher than that of the DSSC with the Csbnd ZnO film (4.77%). This higher efficiency is attributed to the superior charge transfer and light-scattering abilities provided by coral-like ZnO nanocrystals and hexagonal clubs-like ZnO submicrocrystals, respectively, with reference to these parameters of Csbnd ZnO.

  16. Growth and conduction mechanism of As-doped p-type ZnO thin films deposited by MOCVD

    SciTech Connect

    Ma, Y.; Gao, Q.; Wu, G.G.; Li, W.C.; Gao, F.B.; Yin, J.Z.; Zhang, B.L.; Du, G.T.

    2013-03-15

    Highlight: ► P-type As-doped ZnO thin films was fabricated by MOCVD after post-growth annealing. ► The formation mechanism of p-ZnO with high hole concentration above 10{sup 19} cm{sup −3} was elucidated. ► Besides As{sub Zn}–2V{sub Zn} complex, C impurities also played an important role in realizing p-ZnO. ► The formations of As{sub O} and O-C-O complex were partially contributed to the p-type ZnO: As films. - Abstract: As-doped p-type ZnO thin films were fabricated by metal organic chemical vapor deposition (MOCVD) after in situ annealing in a vacuum. The p-type conduction mechanism was suggested by the analysis of X-ray photoelectron spectroscopy and ultraviolet photoemission spectroscopy. It was found that most of the As dopants in p-ZnO thin films formed As{sub Zn}–2V{sub Zn} shallow acceptor complex, simultaneously, carbon impurities also played an important role in realizing p-type conductivity in ZnO. Substitutional carbon on oxygen site created passivated defect bands by combining with Ga atoms due to the donor-acceptor pair Coulomb binding, which shifted the valence-band maximum upwards for ZnO and thus increased the hole concentration.

  17. Nitrogen-doped p-type ZnO films prepared from nitrogen gas radio-frequency magnetron sputtering

    SciTech Connect

    Tu, M.-L.; Su, Y.-K.; Ma, C.-Y.

    2006-09-01

    Wide band gap nitrogen-doped p-type ZnO films are prepared by radio-frequency magnetron sputtering from a 99.99% purity ZnO target. The sputtering gas is Ar mixed with various flow rates of nitrogen gas. Hole concentrations increase from 1.89x10{sup 15} to 2.11x10{sup 19} cm{sup -3} as the N{sub 2} flow rate decreases from 15 to 6 SCCM (SCCM denotes cubic centimeter per minute at STP), i.e., increasing N{sub 2} flow rate above 6 SCCM decreases the p-type carrier concentration. Microphotoluminescence (PL) spectra peaks are in the near-UV range and change from 384 nm (3.23 eV) to 374 nm (3.32 eV) with increasing N{sub 2} flow rate. The PL peaks agree with the band gap of bulk ZnO, which comes from the recombination of free excitons. Raman spectra show six peaks: 436 (E{sub 2} high-frequency phonon mode for undoped ZnO film), 581 [A{sub 1} (LO) mode in ZnO:N film], 275, 508, 640, and 854 cm{sup -1} (local vibrational modes of Raman features in N-doped ZnO film)

  18. Structural, electrical, and optical properties of atomic layer deposition Al-doped ZnO films

    SciTech Connect

    Banerjee, P; Lee, W. J.; Bae, K. R.; Lee, Sang Bok; Rubloff, Gary W

    2010-01-01

    Al-doped ZnO (AZO) films of ~100nm thickness with various Aldoping were prepared at 150°C by atomic layer deposition on quartz substrates. At low Aldoping, the films were strongly textured along the [100] direction, while at higher Aldoping the films remained amorphous. Atomic force microscopy results showed that Al–O cycles when inserted in a ZnOfilm, corresponding to a few atomic percent Al, could remarkably reduce the surface roughness of the films. Hall measurements revealed a maximum mobility of 17.7cm{sup 2} /Vs . Film resistivity reached a minima of 4.4×10{sup -3} Ωcm whereas the carrier concentration reached a maxima of 1.7×10{sup 20} cm{sup -3} , at 3 at.% Al. The band gap of AZO films varied from 3.23 eV for undoped ZnOfilms to 3.73 eV for AZO films with 24.6 at.% Al. Optical transmittance over 80% was obtained in the visible region. The detrimental impact of increased Al resulting in decreased conductivity due to doping past 3.0 at.% is evident in the x-ray diffraction data, as an abrupt increase in the optical band gap and as a deviation from the Burstein–Moss effect.

  19. Energy dissipation channels affecting photoluminescence from resonantly excited Er3+ ions doped in epitaxial ZnO host films

    NASA Astrophysics Data System (ADS)

    Akazawa, Housei; Shinojima, Hiroyuki

    2015-04-01

    We identified prerequisite conditions to obtain intense photoluminescence at 1.54 μm from Er3+ ions doped in ZnO host crystals. The epitaxial ZnO:Er films were grown on sapphire C-plane substrates by sputtering, and Er3+ ions were resonantly excited at a wavelength of 532 nm between energy levels of 4I15/2 and 2H11/2. There is a threshold deposition temperature between 500 and 550 °C, above which epitaxial ZnO films become free of miss-oriented domains. In this case, Er3+ ions are outside ZnO crystallites, having the same c-axis lattice parameters as those of undoped ZnO crystals. The improved crystallinity was correlated with enhanced emissions peaking at 1538 nm. Further elevating the deposition temperature up to 650 °C generated cracks in ZnO crystals to relax the lattice mismatch strains, and the emission intensities from cracked regions were three times as large as those from smooth regions. These results can be consistently explained if we assume that emission-active Er3+ ions are those existing at grain boundaries and bonded to single-crystalline ZnO crystallites. In contrast, ZnO:Er films deposited on a ZnO buffer layer exhibited very weak emissions because of their degraded crystallinity when most Er3+ ions were accommodated into ZnO crystals. Optimizing the degree of oxidization of ZnO crystals is another important factor because reduced films suffer from non-radiative decay of excited states. The optimum Er content to obtain intense emissions was between 2 and 4 at. %. When 4 at. % was exceeded, the emission intensity was severely attenuated because of concentration quenching as well as the degradation in crystallinity. Precipitation of Er2O3 crystals was clearly observed at 22 at. % for films deposited above 650 °C. Minimizing the number of defects and impurities in ZnO crystals prevents energy dissipation, thus exclusively utilizing the excitation energy to emissions from Er3+ ions.

  20. Studies on visible light photocatalytic and antibacterial activities of nanostructured cobalt doped ZnO thin films prepared by sol-gel spin coating method

    NASA Astrophysics Data System (ADS)

    Poongodi, G.; Anandan, P.; Kumar, R. Mohan; Jayavel, R.

    2015-09-01

    Nanostructured cobalt doped ZnO thin films were deposited on glass substrate by sol-gel spin coating technique and characterized by X-ray diffraction, X-ray photoelectron spectroscopy, field-emission scanning electron microscopy, energy-dispersive X-ray spectroscopy and UV-Vis spectroscopy. The XRD results showed that the thin films were well crystalline with hexagonal wurtzite structure. The results of EDAX and XPS revealed that Co was doped into ZnO structure. FESEM images revealed that the films possess granular morphology without any crack and confirm that Co doping decreases the grain size. UV-Vis transmission spectra show that the substitution of Co in ZnO leads to band gap narrowing. The Co doped ZnO films were found to exhibit improved photocatalytic activity for the degradation of methylene blue dye under visible light in comparison with the undoped ZnO film. The decrease in grain size and extending light absorption towards the visible region by Co doping in ZnO film contribute equally to the improved photocatalytic activity. The bactericidal efficiency of Co doped ZnO films were investigated against a Gram negative (Escherichia coli) and a Gram positive (Staphylococcus aureus) bacteria. The optical density (OD) measurement showed better bactericidal activity at higher level of Co doping in ZnO.

  1. Studies on visible light photocatalytic and antibacterial activities of nanostructured cobalt doped ZnO thin films prepared by sol-gel spin coating method.

    PubMed

    Poongodi, G; Anandan, P; Kumar, R Mohan; Jayavel, R

    2015-09-05

    Nanostructured cobalt doped ZnO thin films were deposited on glass substrate by sol-gel spin coating technique and characterized by X-ray diffraction, X-ray photoelectron spectroscopy, field-emission scanning electron microscopy, energy-dispersive X-ray spectroscopy and UV-Vis spectroscopy. The XRD results showed that the thin films were well crystalline with hexagonal wurtzite structure. The results of EDAX and XPS revealed that Co was doped into ZnO structure. FESEM images revealed that the films possess granular morphology without any crack and confirm that Co doping decreases the grain size. UV-Vis transmission spectra show that the substitution of Co in ZnO leads to band gap narrowing. The Co doped ZnO films were found to exhibit improved photocatalytic activity for the degradation of methylene blue dye under visible light in comparison with the undoped ZnO film. The decrease in grain size and extending light absorption towards the visible region by Co doping in ZnO film contribute equally to the improved photocatalytic activity. The bactericidal efficiency of Co doped ZnO films were investigated against a Gram negative (Escherichia coli) and a Gram positive (Staphylococcus aureus) bacteria. The optical density (OD) measurement showed better bactericidal activity at higher level of Co doping in ZnO.

  2. Improved efficiency of the chemical bath deposition method during growth of ZnO thin films

    SciTech Connect

    Ortega-Lopez, Mauricio; Avila-Garcia, Alejandro; Albor-Aguilera, M.L.; Resendiz, V.M. Sanchez

    2003-06-19

    Chemical bath deposition (CBD) is an inexpensive and low temperature method (25-90 deg. C) that allows to deposit large area semiconductor thin films. However, the extent of the desired heterogeneous reaction upon the substrate surface is limited first by the competing homogeneous reaction, which is responsible for colloidal particles formation in the bulk solution, and second, by the material deposition on the CBD reactor walls. Therefore, the CBD method exhibits low efficiency in terms of profiting the whole amount of starting materials. The present work describes a procedure to deposit ZnO thin films by CBD in an efficient way, since it offers the possibility to minimize both the undesirable homogeneous reaction in the bulk solution and the material deposition on the CBD reactor walls. In a first stage, zinc peroxide (ZnO{sub 2}) crystallizing with cubic structure is obtained. This compound shows a good average transparency (90%) and an optical bandgap of 4.2 eV. After an annealing process, the ZnO{sub 2} suffers a transformation toward polycrystalline ZnO with hexagonal structure and 3.25 eV of optical bandgap. The surface morphology of the films, analyzed by atomic force microscope (AFM), reveals three-dimensional growth features as well as no colloidal particles upon the surface, therefore indicating the predominance of the heterogeneous reaction during the growth.

  3. Exploration of Al-Doped ZnO in Photovoltaic Thin Films

    NASA Astrophysics Data System (ADS)

    Ciccarino, Christopher; Sahiner, M. Alper

    The electrical properties of Al doped ZnO-based thin films represent a potential advancement in the push for increasing solar cell efficiency. Doping with Aluminum will theoretically decrease resistivity of the film and therefore achieve this potential as a viable option in the P-N junction phase of photovoltaic cells. The n-type semi-conductive characteristics of the ZnO layer will theoretically be optimized with the addition of Aluminum carriers. In this study, Aluminum doping concentrations ranging from 1-3% by mass were produced, analyzed, and compared. Films were developed onto ITO coated glass using the Pulsed Laser Deposition technique. Target thickness was 250 nm and ellipsometry measurements showed uniformity and accuracy in this regard. Active dopant concentrations were determined using Hall Effect measurements. Efficiency measurements showed possible applications of this doped compound, with upwards of 7% efficiency measured, using a Keithley 2602 SourceMeter set-up. XRD scans showed highly crystalline structures, with effective Al intertwining of the hexagonal wurtzile ZnO molecular structure. This alone indicates a promising future of collaboration between these two materials.

  4. The roles of buffer layer thickness on the properties of the ZnO epitaxial films

    NASA Astrophysics Data System (ADS)

    Tang, Kun; Huang, Shimin; Gu, Shulin; Zhu, Shunming; Ye, Jiandong; Xu, Zhonghua; Zheng, Youdou

    2016-12-01

    In this article, the authors have investigated the optimization of the buffer thickness for obtaining high-quality ZnO epi-films on sapphire substrates. The growth mechanism of the buffers with different thickness has been clearly revealed, including the initial nucleation and vertical growth, the subsequent lateral growth with small grain coalescence, and the final vertical growth along the existing larger grains. Overall, the quality of the buffer improves with increasing thickness except the deformed surface morphology. However, by a full-scale evaluation of the properties for the epi-layers, the quality of the epi-film is briefly determined by the surface morphology of the buffer, rather than the structural, optical, or electrical properties of it. The best quality epi-layer has been grown on the buffer with a smooth surface and well-coalescent grains. Meanwhile, due to the huge lattice mismatch between sapphire and ZnO, dislocations are inevitably formed during the growth of buffers. More importantly, as the film grows thicker, the dislocations may attracting other smaller dislocations and defects to reduce the total line energy and thus result in the formation of V-shape defects, which are connected with the bottom of the threading dislocations in the buffers. The V-defects appear as deep and large hexagonal pits from top view and they may act as electron traps which would affect the free carrier concentration of the epi-layers.

  5. Self-erasing and rewritable wettability patterns on ZnO thin films

    SciTech Connect

    Kekkonen, Ville; Hakola, Antti; Kajava, Timo; Ras, Robin H. A.; Sahramo, Elina; Malm, Jari; Karppinen, Maarit

    2010-07-26

    Self-erasing patterns allow a substrate to be patterned multiple times or could store temporary information for secret communications, and are mostly based on photochromic molecules to change the color of the pattern. Herein we demonstrate self-erasing patterns of wettability on thin ZnO films made by atomic layer deposition. Hydrophilic patterns are written using UV light and decay spontaneously, i.e. become hydrophobic, or are erased aided by vacuum conditions or heat. We demonstrate that these patterns can be applied for channels to confine flow of water without physical walls.

  6. Alternate deposition and hydrogen doping technique for ZnO thin films

    NASA Astrophysics Data System (ADS)

    Myong, Seung Yeop; Lim, Koeng Su

    2006-08-01

    We propose an alternate deposition and hydrogen doping (ADHD) technique for polycrystalline hydrogen-doped ZnO thin films, which is a sublayer-by-sublayer deposition based on metalorganic chemical vapor deposition and mercury-sensitized photodecomposition of hydrogen doping gas. Compared to conventional post-deposition hydrogen doping, the ADHD process provides superior electrical conductivity, stability, and surface roughness. Photoluminescence spectra measured at 10 K reveal that the ADHD technique improves ultraviolet and violet emissions by suppressing the green and yellow emissions. Therefore, the ADHD technique is shown to be very promising aid to the manufacture of improved transparent conducting electrodes and light emitting materials.

  7. Magnetic field influence on the transient photoresistivity of defect-induced magnetic ZnO films

    NASA Astrophysics Data System (ADS)

    Zapata, C.; Khalid, M.; Simonelli, G.; Villafuerte, M.; Heluani, S. P.; Esquinazi, P.

    2011-09-01

    Magnetic field dependent photoresistivity was measured at 280 K in ZnO ferromagnetic films grown on r-plane Al2O3 under a N2 atmosphere. A correlation between the negative magneto photoresistivity and the existence of defect-induced magnetic order was found. The effect of magnetic field on the transient photoresistivity is to slow down the recombination process enhancing the photocarriers density. The experimental results demonstrate the possibility of tuning photocarriers life time using magnetic field in diluted magnetic semiconductors.

  8. Microstructural and conductivity comparison of Ag films grown on amorphous TiO2 and polycrystalline ZnO

    SciTech Connect

    Dannenberg, Rand; Stach, Eric; Glenn, Darin; Sieck, Peter; Hukari, Kyle

    2001-03-26

    8 nm thick Ag films were sputter deposited onto amorphous TiO{sub 2} underlayers 25 nm thick, and also amorphous TiO{sub 2} (25 nm)/ZnO (5 nm) multiunderlayers. The substrates were back-etched Si with a 50 nm thick LPCVD Si{sub 3}N{sub 4} electron transparent membrane. The ZnO, sputtered onto amorphous TiO{sub 2}, formed a continuous layer with a grain size of 5 nm in diameter, on the order of the film thickness. There are several microstructural differences in the Ag dependent on the underlayers, revealed by TEM. First a strong {l_brace}0001{r_brace} ZnO to {l_brace}111{r_brace} Ag fibre-texture relationship exists. On TiO{sub 2} the Ag microstructure shows many abnormal grains whose average diameter is about 60-80 nm, whereas the films on ZnO show few abnormal grains. The background matrix of normal grains on the TiO{sub 2} is roughly 15 nm, while the normal grain size on the ZnO is about 25 nm. Electron diffraction patterns show that the film on ZnO has a strong {l_brace}111{r_brace} orientation, and dark field images with this diffraction condition have a grain size of about 30 nm. In a region near the center of the TEM grid where there is the greatest local heating during deposition, Ag films grown on amorphous TiO{sub 2} are discontinuous, whereas on ZnO, the film is continuous. When films 8 nm films are grown on solid glass substrates, those with ZnO underlayers have sheet resistances of 5.68 {Omega}/, whereas those on TiO{sub 2} are 7.56 {Omega}/, and when 16 nm thick, the corresponding sheet resistances are 2.7 {Omega}/ and 3.3 {Omega}/. The conductivity difference is very repeatable. The improved conductivity is thought to be a combined effect of reduced grain boundary area per unit volume, the predominance of low grain boundary resistivity Coincidence Site Lattice boundaries from the Ag {l_brace}111{r_brace} orientation, and Ag planarization on ZnO resulting in less groove formation on deposition, concluded from atomic force microscopy.

  9. Deposition of F-doped ZnO transparent thin films using ZnF2-doped ZnO target under different sputtering substrate temperatures.

    PubMed

    Wang, Fang-Hsing; Yang, Cheng-Fu; Lee, Yen-Hsien

    2014-02-26

    Highly transparent and conducting fluorine-doped ZnO (FZO) thin films were deposited onto glass substrates by radio-frequency (RF) magnetron sputtering, using 1.5 wt% zinc fluoride (ZnF2)-doped ZnO as sputtering target. Structural, electrical, and optical properties of the FZO thin films were investigated as a function of substrate temperature ranging from room temperature (RT) to 300°C. The cross-sectional scanning electron microscopy (SEM) observation and X-ray diffraction analyses showed that the FZO thin films were of polycrystalline nature with a preferential growth along (002) plane perpendicular to the surface of the glass substrate. Secondary ion mass spectrometry (SIMS) analyses of the FZO thin films showed that there was incorporation of F atoms in the FZO thin films, even if the substrate temperature was 300°C. Finally, the effect of substrate temperature on the transmittance ratio, optical energy gap, Hall mobility, carrier concentration, and resistivity of the FZO thin films was also investigated.

  10. Characteristics of ZnO thin films doped by various elements

    NASA Astrophysics Data System (ADS)

    Kahraman, S.; Çakmak, H. M.; Çetinkaya, S.; Bayansal, F.; Çetinkara, H. A.; Güder, H. S.

    2013-01-01

    We have investigated the effects of Al, K and Co dopant elements on the properties of ZnO thin films deposited by CBD method on glass substrates. Changing in morphology, structural parameters, ionization energies of impurity levels, absorption behavior and optical band gap values were investigated through scanning electron microscopy (SEM), X-Ray diffraction (XRD), resistance-temperature measurement (R-T) and ultraviolet-visible spectroscopy (UV-vis) techniques. From the SEM observations, various morphologies (rod-like, flower-like and rice-like) were observed. Those morphological variations were attributed to the change in stable growth mechanism of intrinsic ZnO, induced by different atomic radius and different electronegativity of dopants. XRD results indicated that all orientations are well indexed to hexagonal phase crystalline ZnO. The impurity level ionization energy values (ΔE) were estimated as 0.32/0.13/0.07 eV; 0.34/0.15 eV; 0.40/0.13 eV and 0.48/0.22 eV for the Al, K, Co doped samples and i-ZnO, respectively. Optical band gap values were found that the doped samples' were higher than the intrinsic one's. This increasing (blue shift) was attributed to a deterioration which occurred in the lattice of the structures after doping. This effect was also supported by the structural results.

  11. Organic photovoltaic cells based on ZnO thin film electrodes.

    PubMed

    Ghica, C; Ion, L; Epurescu, G; Nistor, L; Antohe, S; Dinescu, M

    2010-02-01

    Due to its wide band-gap (ca. 3.4 eV), ZnO is a possible candidate material to be used as transparent electrode for a new class of photovoltaic (PV) cells. Also, an increased interest for the photovoltaic properties of several organic monomers and polymers (merocyanines, phthalocyanines and porphyrins) was noticed, because of their high optical absorption in the visible region of the spectrum allowing them to be used as potential inexpensive materials for solar cells. Preparation and properties of CuPc (copper phthalocyanine) based photovoltaic cells using ZnO thin films as transparent conductor electrodes are presented in this paper. ZnO layers are grown by pulsed laser deposition, while the organic layers are obtained by thermal evaporation. Structural characterization is performed by electron microscopy. Optical and transport properties of the mutilayered structures are obtained by electrical and spectro-photometric measurements. The influence of the ZnO-polymer interface on the external quantum efficiency (EQE) of the photovoltaic cell is clearly evidenced by our measurements.

  12. The Effects of Thermal Annealing on ZnO Thin Films Produced by Spin-Coating Method on Quartz Substrates

    NASA Astrophysics Data System (ADS)

    Ertek, Özlem; Okur, İbrahim

    2015-07-01

    In this work, zinc oxide (ZnO) thin films on quartz substrates were fabricated using the spin-coating method. Thermal annealings from to have been performed in increments and for two annealing durations (0.5 h and 8 h). X-ray diffraction (XRD) spectra, scanning electron microscopy micrographs, and UV-Vis absorption spectra of all the samples have been elucidated from mechanical and optical points of view. It has been observed that for all annealing temperatures, the crystal phase has been obtained. After annealings, a new crystal phase related to (willemite) has also been appeared in XRD spectra. This phase remained stable up to annealing together with the ZnO crystal phase. It has been found that the nano/micro rod diameters of the ZnO crystals reach to a maximum at the annealing for both annealing durations. For annealings, ZnO nanorods appeared to be split into two homogeneous nanorods of length of and of width of (350 nm) which was not the case for all other annealing temperatures. After annealings, ZnO nano/micro rods started to disappear and formed homogeneous ZnO thin films.

  13. Study of the surface properties of ZnO nanocolumns used for thin-film solar cells.

    PubMed

    Neykova, Neda; Stuchlik, Jiri; Hruska, Karel; Poruba, Ales; Remes, Zdenek; Pop-Georgievski, Ognen

    2017-01-01

    Densely packed ZnO nanocolumns (NCs), perpendicularly oriented to the fused-silica substrates were directly grown under hydrothermal conditions at 90 °C, with a growth rate of around 0.2 μm/h. The morphology of the nanostructures was visualized and analyzed by scanning electron microscopy (SEM). The surface properties of ZnO NCs and the binding state of present elements were investigated before and after different plasma treatments, typically used in plasma-enhanced CVD solar cell deposition processes, by X-ray photoelectron spectroscopy (XPS). Photothermal deflection spectroscopy (PDS) was used to investigate the optical and photoelectrical characteristics of the ZnO NCs, and the changes induced to the absorptance by the plasma treatments. A strong impact of hydrogen plasma treatment on the free-carrier and defect absorption of ZnO NCs has been directly detected in the PDS spectra. Although oxygen plasma treatment was proven to be more efficient in the surface activation of the ZnO NC, the PDS analysis showed that the plasma treatment left the optical and photoelectrical features of the ZnO NCs intact. Thus, it was proven that the selected oxygen plasma treatment can be of great benefit for the development of thin film solar cells based on ZnO NCs.

  14. Study of the surface properties of ZnO nanocolumns used for thin-film solar cells

    PubMed Central

    Stuchlik, Jiri; Hruska, Karel; Poruba, Ales; Remes, Zdenek; Pop-Georgievski, Ognen

    2017-01-01

    Densely packed ZnO nanocolumns (NCs), perpendicularly oriented to the fused-silica substrates were directly grown under hydrothermal conditions at 90 °C, with a growth rate of around 0.2 μm/h. The morphology of the nanostructures was visualized and analyzed by scanning electron microscopy (SEM). The surface properties of ZnO NCs and the binding state of present elements were investigated before and after different plasma treatments, typically used in plasma-enhanced CVD solar cell deposition processes, by X-ray photoelectron spectroscopy (XPS). Photothermal deflection spectroscopy (PDS) was used to investigate the optical and photoelectrical characteristics of the ZnO NCs, and the changes induced to the absorptance by the plasma treatments. A strong impact of hydrogen plasma treatment on the free-carrier and defect absorption of ZnO NCs has been directly detected in the PDS spectra. Although oxygen plasma treatment was proven to be more efficient in the surface activation of the ZnO NC, the PDS analysis showed that the plasma treatment left the optical and photoelectrical features of the ZnO NCs intact. Thus, it was proven that the selected oxygen plasma treatment can be of great benefit for the development of thin film solar cells based on ZnO NCs. PMID:28326235

  15. Effects of Precursor Concentration on Structural and Optical Properties of ZnO Thin Films Grown on Muscovite Mica Substrates by Sol-Gel Spin-Coating.

    PubMed

    Kim, Younggyu; Leem, Jae-Young

    2016-05-01

    The structural and optical properties of the ZnO thin films grown on mica substrates for different precursor concentrations were investigated. The surface morphologies of all the samples indicated that they consisted of granular structures with spherical nano-sized crystallites. The thickness of the ZnO thin films increased significantly and the optical band gap exhibited a blue shift with an increase in the precursor concentration. It is remarkable that the highest I(NBE)/I(DLE) ratio was observed for the ZnO thin film with 0.8 M precursor concentration, even though cracks formed on the surface of this film.

  16. Electrical and optical properties of Al doped Zno film prepared by spray pyrolysis technique

    NASA Astrophysics Data System (ADS)

    Shrestha, Shankar Prasad; Basnet, Pradeep

    2008-04-01

    Transparent conducting thin films of zinc oxides and aluminum doped zinc oxide (AZO) were prepared by the spray pyrolysis technique using an aqueous solution of dehydrate zinc acetate (CH 3COOH. 2H IIO, pure- Merck A. R. grade) and hex hydrate aluminum chloride (AlCl 3 .6H IIO) on the micro glass slides. The prepared thin films are found to be highly adherent to the substrate and possess uniform conduction. The optical and electrical properties of the film were investigated in terms of different Al concentration in the starting solution and different substrate temperature. Four probe method in Van der pauw configuration was used for electrical resistivity measurements. The resistivity of Al doped film is observed to vary with doping concentration. The lowest resistivity is observed in the film doping with 2 at % [Al/Zn]. The Hall coefficient measurements show that both ZnO and AZO show the n-type conduction. The carrier concentration was observed to be highest at 2 at% of Al doping. The optical measurements of all the samples with aluminum concentrations was found to be >85 % showing the film to be highly transparent in nature. With increase in Al concentration, the optical band gap was observed increase from 3.27 eV to 3.41 eV.

  17. Effects of In, Al and Sn dopants on the structural and optical properties of ZnO thin films.

    PubMed

    Caglar, Yasemin; Ilican, Saliha; Caglar, Mujdat; Yakuphanoglu, Fahrettin

    2007-07-01

    Effect of In, Al and Sn dopants on the optical and structural properties of ZnO thin films have been investigated by X-ray diffraction technique and optical characterization method. X-ray diffraction patterns confirm that the films have polycrystalline nature. The thin films have (002) as the preferred orientation. This (002) preferred orientation is due to the minimal surface energy which the hexagonal structure, c-plane to the ZnO crystallites, corresponds to the densest packed plane. The grain size values of the films are found to be 29.0, 35.2 and 39.5 nm for In, Al and Sn doped ZnO thin films, respectively. The optical band gaps of the films were calculated. The absorption edge shifts to the lower wavelengths with In, Al and Sn dopants. The inclusion of dopant into films expands also width of localized states as E(UIn)>E(UAl)>E(USn). The refractive index dispersion curves obey the single oscillator model. The dispersion parameters and optical constants of the films were determined. These parameters changed with In, Al and Sn dopants.

  18. MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si

    NASA Astrophysics Data System (ADS)

    Black, Kate; Jones, Anthony C.; Chalker, Paul R.; Gaskell, Jeffrey M.; Murray, Robert T.; Joyce, Tim B.; Rushworth, Simon A.

    2008-03-01

    This paper explores the use of nanostructured zinc oxide (ZnO) films as a compliant buffer layer for the growth of gallium nitride (GaN) on silicon substrates. Thin films of ZnO have been deposited on silicon (1 1 1) substrates by liquid injection metalorganic chemical vapour deposition (MOCVD) using dimethyl zinc-tetrahydrofuran adduct and oxygen. The use of the adduct complex avoids pre-reaction between the dialkyl zinc complex and oxygen which has been observed elsewhere. ZnO films deposited by this method were stoichiometric and of high purity, with no detectable carbon contamination. Films were deposited over a temperature range 350-550 °C, and exhibited a nanowire-like morphology. Subsequent deposition of GaN layers grown by molecular beam epitaxy (MBE) on the ZnO film resulted in the transformation of the nanowires to gallium oxide, accompanied by virtually complete removal of zinc from the layer. A heteroepitaxially oriented ( c-axis) GaN/gallium oxide/silicon structure was produced after the nitride deposition which consisted of characteristic columnar GaN with the GaN[0 0 0 1]||Si [1 1 1]. Selective area electron diffraction of the by-product oxide interlayer showed a polycrystalline-like behaviour that gave rise to a random azimuthal distribution of the GaN grains.

  19. Effect of annealing on the structural, morphological and photoluminescence properties of ZnO thin films prepared by spin coating.

    PubMed

    Kumar, Vinod; Kumar, Vijay; Som, S; Yousif, A; Singh, Neetu; Ntwaeaborwa, O M; Kapoor, Avinashi; Swart, H C

    2014-08-15

    Zinc oxide (ZnO) thin films were deposited on silicon substrates by a sol-gel method using the spin coating technique. The ZnO films were annealed at 700°C in an oxygen environment using different annealing times ranging from 1 to 4 h. It was observed that all the annealed films exhibited a hexagonal wurtzite structure. The particle size increased from 65 to 160 nm with the increase in annealing time, while the roughness of the films increased from 2.3 to 10.6 nm with the increase in the annealing time. Si diffusion from the substrate into the ZnO layer occurred during the annealing process. It is likely that the Si and O2 influenced the emission of the ZnO by reducing the amount of Zn defects and the creation of new oxygen related defects during annealing in the O2 atmosphere. The emission intensity was found to be dependent on the reflectance of the thin films.

  20. Insight of dipole surface plasmon mediated optoelectronic property tuning of ZnO thin films using Au

    NASA Astrophysics Data System (ADS)

    Dixit, Tejendra; Shukla, Mayoorika; Palani, I. A.; Singh, Vipul

    2016-12-01

    Surface plasmon mediated photoluminescence (PL) studies of ZnO, ZnO/Au, ZnO/Au/ZnO and Au/ZnO films have been investigated. An enhancement of UV and visible light emission has been observed in ZnO/Au and ZnO/Au/ZnO films, compared to that of ZnO thin films, while for Au/ZnO films quenching of PL intensity was observed. Excitation intensity (EI) dependent PL spectra have shown dominance of horizontal dipole surface plasmon mode for ZnO/Au/ZnO, ZnO/Au samples, which led enhanced greenish-yellow and orange emissions respectively. Moreover, confocal laser scanning microscope measurements and diffuse reflectance spectroscopy were conducted to investigate the mechanism behind the variations and involvement of Urbach tail. UV and visible region absorption were selectively enhanced by varying the Au and ZnO configuration and can be assigned to the interaction of the dipole surface plasmon resonance with localized trapping levels and phonon subsystem. The excellent photoluminescence performance has immense potential for ZnO thin film based optoelectronic devices.

  1. Effect of deposition parameters and strontium doping on characteristics of nanostructured ZnO thin film by chemical bath deposition method

    SciTech Connect

    Sheeba, N. H.; Naduvath, J.; Abraham, A. Philip, R. R.; Weiss, M. P. E-mail: zachary.diener@hope.edu E-mail: deyoung@hope.edu; Diener, Z. J. E-mail: zachary.diener@hope.edu E-mail: deyoung@hope.edu; Remillard, S. K. E-mail: zachary.diener@hope.edu E-mail: deyoung@hope.edu; DeYoung, P. A. E-mail: zachary.diener@hope.edu E-mail: deyoung@hope.edu

    2014-10-15

    Polycrystalline thin films of ZnO and Sr-doped ZnO (ZnO:Sr) on ultrasonically cleaned soda lime glass substrates are synthesized through successive ionic layer adsorption and reaction. The XRD profiles of ZnO and ZnO:Sr films prepared at different number of deposition cycles exhibit hexagonal wurtzite structure with preferred orientation along (002) direction. The crystallites are found to be nano sized, having variation in size with the increase in number of depositions cycles and also with Sr doping. Optical absorbance studies reveal a systematically controllable blueshift in band gap of Sr-doped ZnO films. SEM images indicate enhanced assembling of crystallites to form elongated rods as number of dips increased in Sr doped ZnO. The films are found to be n-type with the Sr doping having little effect on the electrical properties.

  2. Effect of deposition parameters and strontium doping on characteristics of nanostructured ZnO thin film by chemical bath deposition method

    NASA Astrophysics Data System (ADS)

    Sheeba, N. H.; Naduvath, J.; Abraham, A.; Weiss, M. P.; Diener, Z. J.; Remillard, S. K.; DeYoung, P. A.; Philip, R. R.

    2014-10-01

    Polycrystalline thin films of ZnO and Sr-doped ZnO (ZnO:Sr) on ultrasonically cleaned soda lime glass substrates are synthesized through successive ionic layer adsorption and reaction. The XRD profiles of ZnO and ZnO:Sr films prepared at different number of deposition cycles exhibit hexagonal wurtzite structure with preferred orientation along (002) direction. The crystallites are found to be nano sized, having variation in size with the increase in number of depositions cycles and also with Sr doping. Optical absorbance studies reveal a systematically controllable blueshift in band gap of Sr-doped ZnO films. SEM images indicate enhanced assembling of crystallites to form elongated rods as number of dips increased in Sr doped ZnO. The films are found to be n-type with the Sr doping having little effect on the electrical properties.

  3. Evidence of Negative Capacitance in Piezoelectric ZnO Thin Films Sputtered on Interdigital Electrodes.

    PubMed

    Laurenti, Marco; Verna, Alessio; Chiolerio, Alessandro

    2015-11-11

    The scaling paradigm known as Moore's Law, with the shrinking of transistors and their doubling on a chip every two years, is going to reach a painful end. Another less-known paradigm, the so-called Koomey's Law, stating that the computing efficiency doubles every 1.57 years, poses other important challenges, since the efficiency of rechargeable energy sources is substantially constant, and any other evolution is based on device architecture only. How can we still increase the computational power/reduce the power consumption of our electronic environments? A first answer to this question comes from the quest for new functionalities. Within this aim, negative capacitance (NC) is becoming one of the most intriguing and studied phenomena since it can be exploited for reducing the aforementioned limiting effects in the downscaling of electronic devices. Here we report the evidence of negative capacitance in 80 nm thick ZnO thin films sputtered on Au interdigital electrodes (IDEs). Highly (002)-oriented ZnO thin films, with a fine-grained surface nanostructure and the desired chemical composition, are deposited at room temperature on different IDEs structures. Direct-current electrical measurements highlighted the semiconducting nature of ZnO (current density in the order of 1 × 10(-3) A/cm(2)). When turned into the alternating current regime (from 20 Hz to 2 MHz) the presence of NC values is observed in the low-frequency range (20-120 Hz). The loss of metal/semiconductor interface charge states under forward bias conditions, together with the presence of oxygen vacancies and piezoelectric/electrostriction effects, is believed to be at the basis of the observed negative behavior, suggesting that ZnO thin-film-based field-effect transistors can be a powerful instrument to go beyond the Boltzmann limit and the downscaling of integrated circuit elements required for the fabrication of portable and miniaturized electronic devices, especially for electric household

  4. Influence of parallel vs. perpendicular source geometry on cathodic: Arc efficiency and film quality for generation of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Eno, D. M.; DeLeon, R. L.; Garvey, J. F.

    2014-01-01

    ZnO films have been grown on Si (111) substrates using a modified PAMBD (pulsed arc molecular beam deposition) reactive cathodic arc source employing either O2, N2, or NH3 as carrier gas. Utilizing new source geometry, a two to three fold improvement in source efficiency has been realized. Scanning electron microscopy analysis confirms that this new source configuration gives a significant reduction in marcoparticle contamination and exhibits good crystalline properties for room temperature deposition. ZnO films were grown with this new source and characterized using X-ray diffraction and X-ray photoelectron spectroscopy.

  5. Resistive switching behavior of RF magnetron sputtered ZnO thin films

    SciTech Connect

    Rajalakshmi, R.; Angappane, S.

    2015-06-24

    The resistive switching characteristics of RF magnetron sputtered zinc oxide thin films have been studied. The x-ray diffraction studies confirm the formation of crystalline ZnO on Pt/TiO{sub 2}/SiO{sub x}/Si substrate. We have fabricated Cu/ZnO/Pt device using a shadow masking technique for resistive switching study. Our Cu/ZnO/Pt device exhibits a unipolar resistive switching behaviour. The switching observed in our device could be related to oxygen vacancies or Cu ions that generate the conducting filaments responsible for resistive switching. We found HRS to LRS resistance ratio of as high as ∼200 for our Cu/ZnO/Pt device. The higher resistance ratio and stability of Cu/ZnO/Pt device would make our RF magnetron sputtered zinc oxide thin films suitable for non volatile memory applications.

  6. Sputter deposition of Al-doped ZnO films with various incident angles

    SciTech Connect

    Sato, Yasushi; Yanagisawa, Kei; Oka, Nobuto; Nakamura, Shin-ichi; Shigesato, Yuzo

    2009-09-15

    Al-doped ZnO (AZO) films were sputter deposited on glass substrates heated at 200 degree sign C under incident angles of sputtered particles at 0 degree sign (incidence normal to substrate), 20 deg., 40 deg., 60 deg., and 80 deg. In the case of normal incidence, x-ray diffraction pole figures show a strong [001] preferred orientation normal to the film surface. In contrast, in the case wherein the incident angles were higher than 60 degree sign , the [001] orientation inclined by 25 deg. - 35 deg. toward the direction of sputtered particles. Transmission electron microscopy revealed that the tilt angle of the [001] orientation increased with increasing angle of the incident sputtered particles, whereas the columnar structure did not show any sign of inclination with respect to the substrate plane.

  7. High electron mobility ZnO film for high-performance inverted polymer solar cells

    SciTech Connect

    Lv, Peiwen; Chen, Shan-Ci; Zheng, Qingdong; Huang, Feng Ding, Kai

    2015-04-20

    High-quality ZnO films (ZnO-MS) are prepared via magnetron sputtering deposition with a high mobility of about 2 cm{sup 2}/(V·s) and are used as electron transport layer for inverted polymer solar cells (PSCs) with polymer poly[4,8-bis(5-(2-ethylhexyl)thiophen-2-yl)benzo[1,2-b:4,5-b′] dithiophene-co-3-fluorothieno[3,4-b]thiophene-2-carboxylate]:[6,6]-phenyl C71-butyric acid methyl ester as the active layer. A significant improvement of J{sub SC}, about 20% enhancement in contrast to the devices built on sol-gel derived ZnO film (ZnO-Sol), is found in the ZnO-MS based device. High performance ZnO-MS based PSCs exhibit power conversion efficiency (PCE) up to 8.55%, which is much better than the device based on ZnO-Sol (PCE = 7.78%). Further research on cathode materials is promising to achieve higher performance.

  8. High electron mobility ZnO film for high-performance inverted polymer solar cells

    NASA Astrophysics Data System (ADS)

    Lv, Peiwen; Chen, Shan-Ci; Zheng, Qingdong; Huang, Feng; Ding, Kai

    2015-04-01

    High-quality ZnO films (ZnO-MS) are prepared via magnetron sputtering deposition with a high mobility of about 2 cm2/(V.s) and are used as electron transport layer for inverted polymer solar cells (PSCs) with polymer poly[4,8-bis(5-(2-ethylhexyl)thiophen-2-yl)benzo[1,2-b:4,5-b']dithiophene-co-3-fluorothieno[3,4-b]thiophene-2-carboxylate]:[6,6]-phenyl C71-butyric acid methyl ester as the active layer. A significant improvement of JSC, about 20% enhancement in contrast to the devices built on sol-gel derived ZnO film (ZnO-Sol), is found in the ZnO-MS based device. High performance ZnO-MS based PSCs exhibit power conversion efficiency (PCE) up to 8.55%, which is much better than the device based on ZnO-Sol (PCE = 7.78%). Further research on cathode materials is promising to achieve higher performance.

  9. ZnO transparent conductive oxide for thin film silicon solar cells

    NASA Astrophysics Data System (ADS)

    Söderström, T.; Dominé, D.; Feltrin, A.; Despeisse, M.; Meillaud, F.; Bugnon, G.; Boccard, M.; Cuony, P.; Haug, F.-J.; Faÿ, S.; Nicolay, S.; Ballif, C.

    2010-03-01

    There is general agreement that the future production of electric energy has to be renewable and sustainable in the long term. Photovoltaic (PV) is booming with more than 7GW produced in 2008 and will therefore play an important role in the future electricity supply mix. Currently, crystalline silicon (c-Si) dominates the market with a share of about 90%. Reducing the cost per watt peak and energy pay back time of PV was the major concern of the last decade and remains the main challenge today. For that, thin film silicon solar cells has a strong potential because it allies the strength of c-Si (i.e. durability, abundancy, non toxicity) together with reduced material usage, lower temperature processes and monolithic interconnection. One of the technological key points is the transparent conductive oxide (TCO) used for front contact, barrier layer or intermediate reflector. In this paper, we report on the versatility of ZnO grown by low pressure chemical vapor deposition (ZnO LP-CVD) and its application in thin film silicon solar cells. In particular, we focus on the transparency, the morphology of the textured surface and its effects on the light in-coupling for micromorph tandem cells in both the substrate (n-i-p) and superstrate (p-i-n) configurations. The stabilized efficiencies achieved in Neuchâtel are 11.2% and 9.8% for p-i-n (without ARC) and n-i-p (plastic substrate), respectively.

  10. Interaction between O{sub 2} and ZnO films probed by time-dependent second-harmonic generation

    SciTech Connect

    Andersen, S. V.; Vandalon, V.; Bosch, R. H. E. C.; Loo, B. W. H. van de; Kessels, W. M. M.; Pedersen, K.

    2014-02-03

    The interaction between O{sub 2} and ZnO thin films prepared by atomic layer deposition has been investigated by time-dependent second-harmonic generation, by probing the electric field induced by adsorbed oxygen molecules on the surface. The second-harmonic generated signal decays upon laser exposure due to two-photon assisted desorption of O{sub 2}. Blocking and unblocking the laser beam for different time intervals reveals the adsorption rate of O{sub 2} onto ZnO. The results demonstrate that electric field induced second-harmonic generation provides a versatile non-contact probe of the adsorption kinetics of molecules on ZnO thin films.

  11. Optical properties of antimony-doped p-type ZnO films fabricated by pulsed laser deposition

    SciTech Connect

    Pan, X. H.; Guo, W.; Pan, X. Q.; Ye, Z. Z.; He, H. P.; Liu, B.; Che, Y.

    2009-06-01

    We investigated optical properties of Sb-doped p-type ZnO films grown on n-Si (100) substrates by oxygen plasma-assisted pulsed laser deposition. Two acceptor states, with the acceptor levels of 161 and 336 meV, are identified by well-resolved photoluminescence spectra. Under oxygen-rich conditions, the deep acceptor in Sb-doped ZnO film is Zn vacancy. The shallow acceptor is Sb{sub Zn}-2V{sub Zn} complex induced by Sb doping. The origin of p-type behavior in Sb-doped ZnO has been ascribed to the formation of Sb{sub Zn}-2V{sub Zn} complex.

  12. Sol–Gel and Thermally Evaporated Nanostructured Thin ZnO Films for Photocatalytic Degradation of Trichlorophenol

    PubMed Central

    2009-01-01

    In the present work, thermal evaporation and sol–gel coating techniques were applied to fabricate nanostructured thin ZnO films. The phase structure and surface morphology of the obtained films were investigated by X-ray diffractometer (XRD) and scanning electron microscope (SEM), respectively. The topography and 2D profile of the thin ZnO films prepared by both techniques were studied by optical profiler. The results revealed that the thermally evaporated thin film has a comparatively smoother surface of hexagonal wurtzite structure with grain size 12 nm and 51 m2/g. On the other hand, sol–gel films exhibited rough surface with a strong preferred orientation of 25 nm grain size and 27 m2/g surface area. Following deposition process, the obtained films were applied for the photodegradation of 2,4,6-trichlorophenol (TCP) in water in presence of UV irradiation. The concentrations of TCP and its intermediates produced in the solution during the photodegradation were determined by high performance liquid chromatography (HPLC) at defined irradiation times. Complete decay of TCP and its intermediates was observed after 60 min when the thermal evaporated photocatalyst was applied. However, by operating sol–gel catalyst, the concentration of intermediates initially increased and then remained constant with irradiation time. Although the degradation of TCP followed first-order kinetic for both catalysts, higher photocatalytic activity was exhibited by the thermally evaporated ZnO thin film in comparison with sol–gel one. PMID:20596419

  13. ZnO thin film deposition using colliding plasma plumes and single plasma plume: Structural and optical properties

    SciTech Connect

    Gupta, Shyam L. Thareja, Raj K.

    2013-12-14

    We report the comparative study on synthesis of thin films of ZnO on glass substrates using IR laser ablated colliding plasma plumes and conventional pulsed laser deposition using 355 nm in oxygen ambient. The optical properties of deposited films are characterized using optical transmission in the UV-visible range of spectrum and photoluminescence measurements. X-ray diffraction and atomic force microscopy are used to investigate the surface morphology of synthesized ZnO films. The films synthesized using colliding plumes created with 1064 nm are non-polar a-plane ZnO with transmission in UV-visible (300–800 nm) region ∼60% compared to polycrystalline thin film deposited using single plume which has chunk deposition and poor optical response. However, deposition with 355 nm single plume shows polar c-axis oriented thin film with average roughness (∼thickness) of ∼86 nm (∼850 nm) compared to ∼2 nm (∼3 μm) for 1064 nm colliding plumes. These observed differences in the quality and properties of thin films are attributed to the flux of mono-energetic plasma species with almost uniform kinetic energy and higher thermal velocity reaching the substrate from interaction/stagnation zone of colliding plasma plumes.

  14. Structural; morphological; optical and magnetic properties of Mn doped ferromagnetic ZnO thin film

    NASA Astrophysics Data System (ADS)

    Karmakar, R.; Neogi, S. K.; Banerjee, Aritra; Bandyopadhyay, S.

    2012-12-01

    The structural, optical and magnetic properties of the Zn1-xMnxO (0 < x < 0.05) thin films synthesized by sol-gel technique have been analyzed in the light of modification of the electronic structure and disorder developed in the samples due to Mn doping. The films are of single phase in nature; no formation of any secondary phase has been detected from structural analysis. Absence of magnetic impurity phase in these films has been confirmed from morphological study also. Increasing tendency of lattice parameters and unit cell volume has been observed with increasing Mn doping concentration. The incorporation of Mn2+ ions introduces disorder in the system. That also leads to slight degradation in crystalline quality of the films with increasing doping. The grain size reduces with increase in Mn doping proportion. The band gaps shows red shift with doping and the width of localized states shows an increasing tendency with doping concentration. It is due to the formation of impurity band and trapping of Mn atoms, which leads to the generation of the defect states within the forbidden band. Photoluminescence (PL) spectra show gradual decrease of intensity of exitonic and defect related peaks with increasing Mn doping. Defect mediated intrinsic ferromagnetism has been observed even at room temperature for 5 at% Mn doped ZnO film. The strong presence of antiferromagnetic (AFM) interaction reduces the observed ferromagnetic moments.

  15. Growth of residual stress-free ZnO films on SiO{sub 2}/Si substrate at room temperature for MEMS devices

    SciTech Connect

    Singh, Jitendra; Akhtar, Jamil; Ranwa, Sapana; Kumar, Mahesh

    2015-06-15

    ZnO thick Stress relaxed films were deposited by reactive magnetron sputtering on 2”-wafer of SiO{sub 2}/Si at room temperature. The residual stress of ZnO films was measured by measuring the curvature of wafer using laser scanning method and found in the range of 0.18 x 10{sup 9} to 11.28 x 10{sup 9} dyne/cm{sup 2} with compressive in nature. Sputter pressure changes the deposition rates, which strongly affects the residual stress and surface morphologies of ZnO films. The crystalline wurtzite structure of ZnO films were confirmed by X-ray diffraction and a shift in (0002) diffraction peak of ZnO towards lower 2θ angle was observed with increasing the compressive stress in the films. The band gap of ZnO films shows a red shift from ∼3.275 eV to ∼3.23 eV as compressive stress is increased, unlike the stress for III-nitride materials. A relationship between stress and band gap of ZnO was derived and proposed. The stress-free growth of piezoelectric films is very important for functional devices applications.

  16. Growth of residual stress-free ZnO films on SiO2/Si substrate at room temperature for MEMS devices

    NASA Astrophysics Data System (ADS)

    Singh, Jitendra; Ranwa, Sapana; Akhtar, Jamil; Kumar, Mahesh

    2015-06-01

    ZnO thick Stress relaxed films were deposited by reactive magnetron sputtering on 2"-wafer of SiO2/Si at room temperature. The residual stress of ZnO films was measured by measuring the curvature of wafer using laser scanning method and found in the range of 0.18 x 109 to 11.28 x 109 dyne/cm2 with compressive in nature. Sputter pressure changes the deposition rates, which strongly affects the residual stress and surface morphologies of ZnO films. The crystalline wurtzite structure of ZnO films were confirmed by X-ray diffraction and a shift in (0002) diffraction peak of ZnO towards lower 2θ angle was observed with increasing the compressive stress in the films. The band gap of ZnO films shows a red shift from ˜3.275 eV to ˜3.23 eV as compressive stress is increased, unlike the stress for III-nitride materials. A relationship between stress and band gap of ZnO was derived and proposed. The stress-free growth of piezoelectric films is very important for functional devices applications.

  17. Plasmonic enhancement of UV emission from ZnO thin films induced by Al nano-concave arrays

    NASA Astrophysics Data System (ADS)

    Norek, Małgorzata; Łuka, Grzegorz; Włodarski, Maksymilian

    2016-10-01

    Surface plasmons (SPs) supported by Al nano-concave arrays with increasing interpore distance (Dc) were used to enhance the ultraviolet light emission from ZnO thin films. Two sets of samples were prepared: in the first set the thin ZnO films were deposited directly on Al nanoconcaves (the Al/ZnO samples) and in the second set a 10 nm - Al2O3 spacer was placed between the textured Al and the ZnO films (the Al/Al2O3-ALD/ZnO samples). In the Al/ZnO samples the enhancement was limited by a nonradiative energy dissipation due to the Ohmic loss in the Al metal. However, for the ZnO layer deposited directly on Al nanopits synthesized at 150 V (Dc = 333 ± 18 nm), the largest 9-fold enhancement was obtained by achieving the best energy fit between the near band-edge (NBE) emission from ZnO and the λ(0,1) SPP resonance mode. In the Al/Al2O3-ALD/ZnO samples the amplification of the UV emission was smaller than in the Al/ZnO samples due to a big energy mismatch between the NBE emission and the λ(0,1) plasmonic mode. The results obtained in this work indicate that better tuning of the NBE - λ(0,1) SPP resonance mode coupling is possible through a proper modification of geometrical parameters in the Al/Al2O3-ALD/ZnO system such as Al nano-concave spacing and the thickness of the corresponding layer. This approach will reduce the negative influence of the non-radiative plasmonic modes and most likely will lead to further enhancement of the SP-modulated UV emission from ZnO thin films.

  18. Evaluation of transverse piezoelectric coefficient of ZnO thin films deposited on different flexible substrates: a comparative study on the vibration sensing performance.

    PubMed

    Joshi, Sudeep; Nayak, Manjunatha M; Rajanna, K

    2014-05-28

    We report on the systematic comparative study of highly c-axis oriented and crystalline piezoelectric ZnO thin films deposited on four different flexible substrates for vibration sensing application. The flexible substrates employed for present experimental study were namely a metal alloy (Phynox), metal (aluminum), polyimide (Kapton), and polyester (Mylar). ZnO thin films were deposited by an RF reactive magnetron sputtering technique. ZnO thin films of similar thicknesses of 700 ± 30 nm were deposited on four different flexible substrates to have proper comparative studies. The crystallinity, surface morphology, chemical composition, and roughness of ZnO thin films were evaluated by respective material characterization techniques. The transverse piezoelectric coefficient (d31) value for assessing the piezoelectric property of ZnO thin films on different flexible substrates was measured by a four-point bending method. ZnO thin films deposited on Phynox alloy substrate showed relatively better material characterization results and a higher piezoelectric d31 coefficient value as compared to ZnO films on metal and polymer substrates. In order to experimentally verify the above observations, vibration sensing studies were performed. As expected, the ZnO thin film deposited on Phynox alloy substrate showed better vibration sensing performance. It has generated the highest peak to peak output voltage amplitude of 256 mV as compared to that of aluminum (224 mV), Kapton (144 mV), and Mylar (46 mV). Therefore, metal alloy flexible substrate proves to be a more suitable, advantageous, and versatile choice for integrating ZnO thin films as compared to metal and polymer flexible substrates for vibration sensing applications. The present experimental study is extremely important and helpful for the selection of a suitable flexible substrate for various applications in the field of sensor and actuator technology.

  19. Study of p-type ZnO and MgZnO Thin Films for Solid State Lighting

    SciTech Connect

    Liu, Jianlin

    2015-07-31

    This project on study of p-type ZnO and MgZnO thin films for solid state lighting was carried out by research group of Prof. Jianlin Liu of UCR during the four-year period between August 2011 and July 2015. Tremendous progress has been made on the proposed research. This final report summarizes the important findings.

  20. Optical parameters of Al-doped ZnO nanorod array thin films grown via the hydrothermal method.

    PubMed

    Kim, Soaram; Kim, Min Su; Nam, Giwoong; Park, Hyunggil; Yoon, Hyunsik; Leem, Jae-Young

    2013-09-01

    ZnO seed layers were deposited onto a quartz substrate using the sol--gel method, and Al-doped ZnO (AZO) nanorod array thin films with different Al concentrations that ranged from 0 to 2.0 at. % were grown on the ZnO seed layers via the hydrothermal method. Optical parameters, including the optical band gap, the absorption coefficient, the Urbach energy, the refractive index, the dispersion parameter, and the optical conductivity, were studied to investigate the effects of Al doping on the optical properties of AZO nanorod array thin films. The optical band gaps of the ZnO and AZO nanorod array thin films were 3.206 at 0 at.%, 3.214 at 0.5 at.%, 3.226 at 1.5 at.%, and 3.268 at 2.0 at.%. The Urbach energy gradually decreased from 126 meV (0 at.%) to 70 meV (2.0 at.%) as the Al concentration was increased. The dispersion energy, the single-oscillator energy, the average oscillator wavelength, the average oscillator strength, the refractive index, and the optical conductivity of the AZO nanorod array thin films were all affected by Al doping.

  1. ZnO Nanoparticles/Reduced Graphene Oxide Bilayer Thin Films for Improved NH3-Sensing Performances at Room Temperature.

    PubMed

    Tai, Huiling; Yuan, Zhen; Zheng, Weijian; Ye, Zongbiao; Liu, Chunhua; Du, Xiaosong

    2016-12-01

    ZnO nanoparticles and graphene oxide (GO) thin film were deposited on gold interdigital electrodes (IDEs) in sequence via simple spraying process, which was further restored to ZnO/reduced graphene oxide (rGO) bilayer thin film by the thermal reduction treatment and employed for ammonia (NH3) detection at room temperature. rGO was identified by UV-vis absorption spectra and X-ray photoelectron spectroscope (XPS) analyses, and the adhesion between ZnO nanoparticles and rGO nanosheets might also be formed. The NH3-sensing performances of pure rGO film and ZnO/rGO bilayer films with different sprayed GO amounts were compared. The results showed that ZnO/rGO film sensors exhibited enhanced response properties, and the optimal GO amount of 1.5 ml was achieved. Furthermore, the optimal ZnO/rGO film sensor showed an excellent reversibility and fast response/recovery rate within the detection range of 10-50 ppm. Meanwhile, the sensor also displayed good repeatability and selectivity to NH3. However, the interference of water molecules on the prepared sensor is non-ignorable; some techniques should be researched to eliminate the effect of moisture in the further work. The remarkably enhanced NH3-sensing characteristics were speculated to be attributed to both the supporting role of ZnO nanoparticles film and accumulation heterojunction at the interface between ZnO and rGO. Thus, the proposed ZnO/rGO bilayer thin film sensor might give a promise for high-performance NH3-sensing applications.

  2. ZnO Nanoparticles/Reduced Graphene Oxide Bilayer Thin Films for Improved NH3-Sensing Performances at Room Temperature

    NASA Astrophysics Data System (ADS)

    Tai, Huiling; Yuan, Zhen; Zheng, Weijian; Ye, Zongbiao; Liu, Chunhua; Du, Xiaosong

    2016-03-01

    ZnO nanoparticles and graphene oxide (GO) thin film were deposited on gold interdigital electrodes (IDEs) in sequence via simple spraying process, which was further restored to ZnO/reduced graphene oxide (rGO) bilayer thin film by the thermal reduction treatment and employed for ammonia (NH3) detection at room temperature. rGO was identified by UV-vis absorption spectra and X-ray photoelectron spectroscope (XPS) analyses, and the adhesion between ZnO nanoparticles and rGO nanosheets might also be formed. The NH3-sensing performances of pure rGO film and ZnO/rGO bilayer films with different sprayed GO amounts were compared. The results showed that ZnO/rGO film sensors exhibited enhanced response properties, and the optimal GO amount of 1.5 ml was achieved. Furthermore, the optimal ZnO/rGO film sensor showed an excellent reversibility and fast response/recovery rate within the detection range of 10-50 ppm. Meanwhile, the sensor also displayed good repeatability and selectivity to NH3. However, the interference of water molecules on the prepared sensor is non-ignorable; some techniques should be researched to eliminate the effect of moisture in the further work. The remarkably enhanced NH3-sensing characteristics were speculated to be attributed to both the supporting role of ZnO nanoparticles film and accumulation heterojunction at the interface between ZnO and rGO. Thus, the proposed ZnO/rGO bilayer thin film sensor might give a promise for high-performance NH3-sensing applications.

  3. One-step growth of structured ZnO thin films by chemical bath deposition in aqueous ammonia solution

    NASA Astrophysics Data System (ADS)

    Huang, S M; Bian, Z Q; Chu, J B; Wang, Z A; Zhang, D W; Li, X D; Zhu, H B; Sun, Z

    2009-03-01

    Structured ZnO films have been fabricated on soda-lime glass slides at a low temperature (80-85 °C) by a chemical bath deposition method in one step without seed layers. Mixed aqueous solutions of zinc sulfate, ammonia and thiourea were used at alkaline conditions. The influence of the ammonia concentration in the initial solution on the property of the deposited film was investigated systematically. The morphology, structural and optical properties of the deposited films were examined and characterized by x-ray diffraction (XRD), energy-dispersive spectroscopy x-ray diffraction (EDX), scanning electron microscopy (SEM), Raman spectroscopy and photoluminescence (PL) spectroscopy. Structural analyses with XRD, EDX and SEM revealed that the formed films exhibit a wurtzite hexagonal phase. The deposited film was more preferentially oriented in the (0 0 2) direction with an increase in the ammonia concentration from 0.75 to 2 mol l-1. The optical-phonon E2 mode at 437 cm-1 in the Raman spectrum, together with the XRD and EDX analyses, showed that flower-like and columnar crystalline ZnO films were formed in two ammonia concentration ranges, 0.75-1.4 mol l-1 and 1.6-2.0 mol l-1, respectively. Furthermore, PL spectra showed strong and high intensity peaks of UV emission with suppressed green emission for these deposited ZnO films. ZnS films were formed with a high ammonia concentration of 3.0 M. The formation mechanisms of ZnO, Zn(OH)2 and ZnS phases were discussed.

  4. Structural, electrical and optical properties of Dy doped ZnO thin films grown by buffer assisted pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Ajimsha, R. S.; Das, A. K.; Singh, B. N.; Misra, P.; Kukreja, L. M.

    2010-04-01

    Transparent conductive dysprosium doped ZnO (Dy:ZnO) thin films with preferential orientation in the (0 0 0 2) direction were deposited on (0 0 0 1) sapphire substrate by buffer assisted pulsed laser deposition. The experimental results show that the resistivity of Dy:ZnO thin films decreased to a minimum value of ∼7.6×10 -4 Ω cm with increasing Dy concentration up to ∼0.45 at%, then increased with the further increase of Dy concentration. On the contrary, the band gap and carrier concentration of Dy:ZnO thin films initially increased, then decreased with increase of Dy concentration. The blue shift of band gap of Dy:ZnO thin films with increasing carrier concentration was attributed to the competing effects of Burstein-Moss shift and band gap narrowing. A bright room temperature photoluminescence observed at ∼575 nm in all the Dy:ZnO thin films, with maximum intensity at ∼0.45 at% of Dy doping, was attributed to be due to intra-band transitions of Dy 3+ in ZnO. Near band edge photoluminescence of ZnO was observed at ∼380 nm with photoluminescence intensity decreasing with increase of Dy concentration. Such Dy:ZnO thin films are found to be suitable candidate for luminescent device applications.

  5. Photoluminescence study of p-type vs. n-type Ag-doped ZnO films

    SciTech Connect

    Myers, M. A.; Jian, J.; Khranovskyy, V.; Lee, J. H.; Wang, Han; Wang, Haiyan E-mail: hwang00@tamu.edu

    2015-08-14

    Silver doped ZnO films have been grown on sapphire (0001) substrates by pulsed laser deposition. Hall measurements indicate that p-type conductivity is realized for the films deposited at 500 °C and 750 °C. Transmission electron microscopy images show more obvious and higher density of stacking faults (SFs) present in the p-type ZnO films as compared to the n-type films. Top view and cross sectional photoluminescence of the n- and p-type samples revealed free excitonic emission from both films. A peak at 3.314 eV, attributed to SF emission, has been observed only for the n-type sample, while a weak neutral acceptor peak observed at 3.359 eV in the p-type film. The SF emission in the n-type sample suggests localization of acceptor impurities nearby the SFs, while lack of SF emission for the p-type sample indicates the activation of the Ag acceptors in ZnO.

  6. Quality-enhanced AlN epitaxial films grown on c-sapphire using ZnO buffer layer for SAW applications

    NASA Astrophysics Data System (ADS)

    Fu, Sulei; Li, Qi; Gao, Shuang; Wang, Guangyue; Zeng, Fei; Pan, Feng

    2017-04-01

    AlN epitaxial films with a thin ZnO buffer layer were successfully deposited on c-sapphire by DC magnetron sputtering for surface acoustic wave (SAW) applications. The effect of ZnO buffer layer thickness on structural properties of AlN epitaxial films and the related SAW properties were investigated systematically. The results revealed that a thin ZnO buffer layer can significantly enhance the crystalline quality of AlN films and release the strain in AlN films. The AlN films were epitaxially grown on ZnO buffered-substrate with orientation relationship of (0001) [ 10 1 bar 0 ] AlN//(0001) [ 10 1 bar 0 ] ZnO//(0001) [2 bar 110 ] Al2O3. High frequency SAW devices with a center frequency of 1.4 GHz, a phase velocity of 5600 m/s were achieved on the obtained AlN films. The optimum ZnO buffer layer thickness was found to be 10 nm, resulting in high-quality epitaxial AlN films with a FWHM value of the rocking curve of 0.84°, nearly zero stress and low insertion loss of SAW devices. This work offers an effective approach to achieve high-quality AlN epitaxial films on sapphire substrates for the applications of AlN-based SAW devices.

  7. Structural and optical studies on Nd doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Deepa Rani, T.; Tamilarasan, K.; Elangovan, E.; Leela, S.; Ramamurthi, K.; Thangaraj, K.; Himcinschi, C.; Trenkmann, I.; SchuIze, S.; Hietschold, M.; Liebig, A.; Salvan, G.; Zahn, D. R. T.

    2015-01-01

    Thin films of Zn1-xNdxO were deposited by spray pyrolysis on Si(111) substrates preheated at 400 °C temperature and were studied as a function of neodymium (Nd)-doping concentration. X-ray diffraction (XRD) patterns confirmed that the deposited films possess hexagonal wurtzite ZnO structure. Further, it is observed that the doped films show a preferential orientation along the c-axis (0 0 2), which is perpendicular to the substrate. The un-doped films seem to be having a bit low-crystallinity, which is corroborated by the scanning electron microscope (SEM) analysis that showed nano-crystalline like features. Further, SEM analysis showed that the Nd doping triggers the formation bubble-like structure on top of the nano-crystalline structure. The SEM microstructures are interpreted with the Micro-Raman studies. Photoluminescence (PL) and XRD characterizations indicate that above 5 at.% doping concentrations, the Nd atoms preferentially agglomerate in the large islands.

  8. Enhanced Performance in Al-Doped ZnO Based Transparent Flexible Transparent Thin-Film Transistors Due to Oxygen Vacancy in ZnO Film with Zn-Al-O Interfaces Fabricated by Atomic Layer Deposition.

    PubMed

    Li, Yang; Yao, Rui; Wang, Huanhuan; Wu, Xiaoming; Wu, Jinzhu; Wu, Xiaohong; Qin, Wei

    2017-04-05

    Highly conductive and optical transparent Al-doped ZnO (AZO) thin film composed of ZnO with a Zn-Al-O interface was fabricated by thermal atomic layer deposition (ALD) method. The as-prepared AZO thin film exhibits excellent electrical and optical properties with high stability and compatibility with temperature-sensitive flexible photoelectronic devices; film resistivity is as low as 5.7 × 10(-4) Ω·cm, the carrier concentration is high up to 2.2 × 10(21) cm(-3). optical transparency is greater than 80% in a visible range, and the growth temperature is below 150 °C on the PEN substrate. Compared with the conventional AZO film containing by a ZnO-Al2O3 interface, we propose that the underlying mechanism of the enhanced electrical conductivity for the current AZO thin film is attributed to the oxygen vacancies deficiency derived from the free competitive growth mode of Zn-O and Al-O bonds in the Zn-Al-O interface. The flexible transparent transistor based on this AZO electrode exhibits a favorable threshold voltage and Ion/Ioff ratio, showing promising for use in high-resolution, fully transparent, and flexible display applications.

  9. Post-annealing effect on the room-temperature ferromagnetism in Cu-doped ZnO thin films

    SciTech Connect

    Hu, Yu-Min Kuang, Chein-Hsiun; Han, Tai-Chun; Yu, Chin-Chung; Li, Sih-Sian

    2015-05-07

    In this work, we investigated the structural and magnetic properties of both as-deposited and post-annealed Cu-doped ZnO thin films for better understanding the possible mechanisms of room-temperature ferromagnetism (RT-FM) in ZnO-based diluted magnetic oxides. All of the films have a c-axis-oriented wurtzite structure and display RT-FM. X-ray photoelectron spectroscopy results showed that the incorporated Cu ions in as-deposited films are in 1+ valence state merely, while an additional 2+ valence state occurs in post-annealed films. The presence of Cu{sup 2+} state in post-annealed film accompanies a higher magnetization value than that of as-deposited film and, in particular, the magnetization curves at 10 K and 300 K of the post-annealed film separate distinctly. Since Cu{sup 1+} ion has a filled 3d band, the RT-FM in as-deposited Cu-doped ZnO thin films may stem solely from intrinsic defects, while that in post-annealed films is enhanced due to the presence of CuO crystallites.

  10. Effect of annealing on the properties of Sb doped ZnO thin films prepared by spray pyrolysis technique

    SciTech Connect

    Kumar, N. Sadananda; Bangera, Kasturi V.; Shivakumar, G. K.

    2014-01-28

    Sb doped ZnO thin films have been deposited on glass substrate at 450°C using spray pyrolysis technique. The X-ray diffraction studies revealed that the as deposited films are polycrystalline in nature with (100) preferred orientation. Whereas the films annealed at 450° C for 6h show a preferential orientation along (101) direction. Crystallites size varies from 15.7 nm to 34.95 nm with annealing duration. The Scanning electron microscopic analysis shows the plane and smooth surface of the films. The optical properties of annealed films have shown a variation in the band gap between 3.37 eV and 3.19 eV. Transparency of as grown and annealed films decreases from 78 % to 65% respectively in the visible region. The electrical conductivity of the as grown film shows an increase in the electrical conductivity by one order of magnitude with increase in the annealing duration.

  11. Investigations of rapid thermal annealing induced structural evolution of ZnO: Ge nanocomposite thin films via GISAXS

    NASA Astrophysics Data System (ADS)

    Ceylan, Abdullah; Ozcan, Yusuf; Orujalipoor, Ilghar; Huang, Yen-Chih; Jeng, U.-Ser; Ide, Semra

    2016-06-01

    In this work, we present in depth structural investigations of nanocomposite ZnO: Ge thin films by utilizing a state of the art grazing incidence small angle x-ray spectroscopy (GISAXS) technique. The samples have been deposited by sequential r.f. and d.c. sputtering of ZnO and Ge thin film layers, respectively, on single crystal Si(100) substrates. Transformation of Ge layers into Ge nanoparticles (Ge-np) has been initiated by ex-situ rapid thermal annealing of asprepared thin film samples at 600 °C for 30, 60, and 90 s under forming gas atmosphere. A special attention has been paid on the effects of reactive and nonreactive growth of ZnO layers on the structural evolution of Ge-np. GISAXS analyses have been performed via cylindrical and spherical form factor calculations for different nanostructure types. Variations of the size, shape, and distributions of both ZnO and Ge nanostructures have been determined. It has been realized that GISAXS results are not only remarkably consistent with the electron microscopy observations but also provide additional information on the large scale size and shape distribution of the nanostructured components.

  12. Gas sensor based on ZnO film/silica pillars

    NASA Astrophysics Data System (ADS)

    Liu, Jing; Liang, Yaxiang; Yi, Futing; Wang, Bo; Zhang, Tianchong; Wang, Yuting; Zhou, Yue

    2016-12-01

    Silica submicron pillars are used as substrate for Zinc oxide (ZnO) gas sensor for the first time. The submicron pillars with the large surface ratio can improve the gas sensing performance obviously. Silicon pillars are fabricated by cesium chloride (CsCl) self-assembly lithography and inductively coupled plasma dry etching as substrate, the ZnO film is deposited on the pillars surface by RF magnetron sputtering. With this method, the pillar based gas sensor has the higher gas response, the shorter response and recovery time than the planar one with different working temperatures, different gas concentrations. 300 °C is the best working temperature, for planar gas sensor, the gas response is 22.81 for 1520 ppm ethanol, the response time is 55 s and the recovery time is 169 s. While for the pillar based one, the gas response is 28.20, the response time is 51 s and the recovery time is 92 s.

  13. Growth process optimization of ZnO thin film using atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Weng, Binbin; Wang, Jingyu; Larson, Preston; Liu, Yingtao

    2016-12-01

    The work reports experimental studies of ZnO thin films grown on Si(100) wafers using a customized thermal atomic layer deposition. The impact of growth parameters including H2O/DiethylZinc (DEZn) dose ratio, background pressure, and temperature are investigated. The imaging results of scanning electron microscopy and atomic force microscopy reveal that the dose ratio is critical to the surface morphology. To achieve high uniformity, the H2O dose amount needs to be at least twice that of DEZn per each cycle. If the background pressure drops below 400 mTorr, a large amount of nanoflower-like ZnO grains would emerge and increase surface roughness significantly. In addition, the growth temperature range between 200 °C and 250 °C is found to be the optimal growth window. And the crystal structures and orientations are also strongly correlated to the temperature as proved by electron back-scattering diffraction and x-ray diffraction results.

  14. Luminescence and electrical properties of solution-processed ZnO thin films by adding fluorides and annealing atmosphere

    SciTech Connect

    Choi, Sungho; Park, Byung-Yoon; Jung, Ha-Kyun

    2011-06-15

    Highlights: {yields} Systematic study of the fluorides doped solution-processed ZnO thin films via the luminescence and electrical behaviors. {yields} Defect-related visible emission bands are affected by annealing ambient and fluoride addition. {yields} Adding lithium fluoride followed by annealing in oxygen ambient leads to a controlled defect density with proper TFT performance. -- Abstract: To develop an efficient channel layer for thin film transistors (TFTs), understanding the defect-related luminescence and electrical property is crucial for solution-processed ZnO thin films. Film growth with the fluorides addition, especially using LiF, followed by the oxygen ambient post-annealing leads to decreased defect-related emission as well as enhanced switching property. The saturation mobility and current on/off ratio are 0.31 cm{sup 2} V{sup -1} s{sup -1} and 1.04 x 10{sup 3}. Consequently, we can visualize an optimized process condition and characterization method for solution-processed TFT based on the fluorine-doped ZnO film channel layer by considering the overall emission behavior.

  15. New insights in the structural and morphological properties of sol-gel deposited ZnO multilayer films

    NASA Astrophysics Data System (ADS)

    Demes, T.; Ternon, C.; Riassetto, D.; Roussel, H.; Rapenne, L.; Gélard, I.; Jimenez, C.; Stambouli, V.; Langlet, M.

    2016-08-01

    This study shows how the structural and morphological properties of sol-gel deposited ZnO films can be precisely tuned and selectively controlled. For that purpose, ZnO films have been deposited through a multilayer sol-gel route using solutions of zinc acetate dihydrate (ZAD) diluted in 1-butanol. The opto-geometrical, morphological, and structural properties of these films have been thoroughly studied in relation to the ZAD concentration in butanol, number of deposited single-layers, and heat-treatment conditions. On this basis, different physical processes occurring over the multilayer deposition procedure have been discussed to explain how the experimental parameters influence the film properties and enable to tune the grain size, texture coefficient, and surface coverage rate in a wide range of values. This work is a first step toward the optimized growth of ZnO nanowires on sol-gel films and their subsequent integration in 2D or 3D nanowire-based biosensors.

  16. Growth of controllable ZnO film by atomic layer deposition technique via inductively coupled plasma treatment

    SciTech Connect

    Huang, Hsin-Wei; Chang, Wen-Chih; Lin, Su-Jien; Chueh, Yu-Lun

    2012-12-15

    An inductively coupled plasma technique (ICP), namely, remote-plasma treatment was introduced to ionize the water molecules as the precursor for the deposition of ZnO film via the atomic layer deposition processes. Compared with the H{sub 2}O gas as the precursor for the ALD growth, the ionized water molecules can provide a lesser energy to uniformly stabilize oxidization processes, resulting in a better film quality with a higher resistivity owing to less formation of intrinsic defects at a lower growth temperature. The relationship between resistivity and formation mechanisms have been discussed and investigated through analyses of atomic force microscopy, photonluminescence, and absorption spectra, respectively. Findings indicate that the steric hindrance of the ligands plays an important rule for the ALD-ZnO film sample with the ICP treatment while the limited number of bonding sites will be dominant for the ALD-ZnO film without the ICP treatment owing to decreasing of the reactive sites via the ligand-exchange reaction during the dissociation process. Finally, the enhanced aspect-ratio into the anodic aluminum oxide with the better improved uniform coating of ZnO layer after the ICP treatment was demonstrated, providing an important information for a promising application in electronics based on ZnO ALD films.

  17. Fabrication and Characterization of Fully Transparent ZnO Thin-Film Transistors and Self-Switching Nano-Diodes

    NASA Astrophysics Data System (ADS)

    Sun, Y.; Ashida, K.; Sasaki, S.; Koyama, M.; Maemoto, T.; Sasa, S.; Kasai, S.; Iñiguez-de-la-Torre, I.; González, T.

    2015-10-01

    Fully transparent zinc oxide (ZnO) based thin-film transistors (TFTs) and a new type of rectifiers calls self-switching nano-diodes (SSDs) were fabricated on glass substrates at room temperature by using low resistivity and transparent conducting Al- doped ZnO (AZO) thin-films. The deposition conditions of AZO thin-films were optimized with pulsed laser deposition (PLD). AZO thin-films on glass substrates were characterized and the transparency of 80% and resistivity with 1.6*10-3 Ωcm were obtained of 50 nm thickness. Transparent ZnO-TFTs were fabricated on glass substrates by using AZO thin-films as electrodes. A ZnO-TFT with 2 μm long gate device exhibits a transconductance of 400 μS/mm and an ON/OFF ratio of 2.8*107. Transparent ZnO-SSDs were also fabricated by using ZnO based materials and clear diode-like characteristics were observed.

  18. Rapid-melt-mediated recrystallization of ZnO thin films grown at low temperature by using KrF excimer laser irradiation

    NASA Astrophysics Data System (ADS)

    Oh, Min-Suk; Seo, Inseok

    2015-11-01

    ZnO thin films with thickness of 150 nm were grown on ITO/glass (ITO-coated glass) substrates by using the radio-frequency (RF) sputtering technique at 400 °C in an Ar atmosphere. An excimer laser irradiation (ELI) treatment was performed on the surface of ZnO thin films at different excimer laser energy densities of 150, 200, and 250 mJ/cm2 in a N2 atmosphere. The ELI treatment promoted the lateral recystallization of the surface area of the ZnO, resulting in a significant improvement of the crystallinity of the ZnO thin films without substrate damage. As-grown ZnO and ELI-treated ZnO thin films were characterized by using scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray diffraction (XRD). The analyses showed that the ZnO thin film treated with ELI at an excimer laser energy density of 150 mJ/cm2 exhibited the best structural properties.

  19. ZnO thin film transistor immunosensor with high sensitivity and selectivity

    NASA Astrophysics Data System (ADS)

    Reyes, Pavel Ivanoff; Ku, Chieh-Jen; Duan, Ziqing; Lu, Yicheng; Solanki, Aniruddh; Lee, Ki-Bum

    2011-04-01

    A zinc oxide thin film transistor-based immunosensor (ZnO-bioTFT) is presented. The back-gate TFT has an on-off ratio of 108 and a threshold voltage of 4.25 V. The ZnO channel surface is biofunctionalized with primary monoclonal antibodies that selectively bind with epidermal growth factor receptor (EGFR). Detection of the antibody-antigen reaction is achieved through channel carrier modulation via pseudo double-gating field effect caused by the biochemical reaction. The sensitivity of 10 fM detection of pure EGFR proteins is achieved. The ZnO-bioTFT immunosensor also enables selectively detecting 10 fM of EGFR in a 5 mg/ml goat serum solution containing various other proteins.

  20. Micro-twins TiO2 nanorods grown on seeded ZnO film

    NASA Astrophysics Data System (ADS)

    Zhao, Lei; Xia, Maosheng; Liu, Yuhua; Zheng, Biju; Jiang, Qing; Lian, Jianshe

    2012-04-01

    TiO2 anatase nanorods (NRs) epitaxially grew along the [001] direction at 600 °C on seeded c-axis oriented ZnO films which were deposited on a quartz glass substrate. The length of TiO2 NRs was about 450 nm. Micro-twins (MTs) were found in the TiO2 NRs with the (103) plane as the twin planes. The possible growth mechanisms of these TiO2 MTs have been studied using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM). The photo-degradation experiment showed that the TiO2 NRs have a high degradation efficiency of 32.9%. The effects of structural defects and MTs on the photocatalytic activity have been discussed.

  1. Ga-doped ZnO thin film surface characterization by wavelet and fractal analysis

    NASA Astrophysics Data System (ADS)

    Jing, Chenlei; Tang, Wu

    2016-02-01

    The change in roughness of various thicknesses Ga-doped ZnO (GZO) thin films deposited by magnetron reactive sputtering on glass substrates at room temperature was measured by atomic force microscopy (AFM). Multi-resolution signal decomposition based on wavelet transform and fractal geometry was applied to process surface profiles, to evaluate the roughness trend of relevant frequency resolution. The results give a six-level decomposition and the results change with deposited time and surface morphology. Also, it is found that fractal dimension is closely connected to the underside diameter (grain size) and the distance between adjacent grains that affect the change rate of surface and the increase of the defects such as abrupt changes lead to a larger value of fractal dimension.

  2. Bendable ZnO thin film surface acoustic wave devices on polyethylene terephthalate substrate

    SciTech Connect

    He, Xingli; Guo, Hongwei; Chen, Jinkai; Wang, Wenbo; Xuan, Weipeng; Xu, Yang E-mail: jl2@bolton.ac.uk; Luo, Jikui E-mail: jl2@bolton.ac.uk

    2014-05-26

    Bendable surface acoustic wave (SAW) devices were fabricated using high quality c-axis orientation ZnO films deposited on flexible polyethylene terephthalate substrates at 120 °C. Dual resonance modes, namely, the zero order pseudo asymmetric (A{sub 0}) and symmetric (S{sub 0}) Lamb wave modes, have been obtained from the SAW devices. The SAW devices perform well even after repeated flexion up to 2500 με for 100 times, demonstrating its suitability for flexible electronics application. The SAW devices are also highly sensitive to compressive and tensile strains, exhibiting excellent anti-strain deterioration property, thus, they are particularly suitable for sensing large strains.

  3. Highly Sensitive Ultraviolet Photodetectors Fabricated from ZnO Quantum Dots/Carbon Nanodots Hybrid Films

    PubMed Central

    Guo, Deng-Yang; Shan, Chong-Xin; Qu, Song-Nan; Shen, De-Zhen

    2014-01-01

    Ultraviolet photodetectors have been fabricated from ZnO quantum dots/carbon nanodots hybrid films, and the introduction of carbon nanodots improves the performance of the photodetectors greatly. The photodetectors can be used to detect very weak ultraviolet signals (as low as 12 nW/cm2). The detectivity and noise equivalent power of the photodetector can reach 3.1 × 1017 cmHz1/2/W and 7.8 × 10−20 W, respectively, both of which are the best values ever reported for ZnO-based photodetectors. The mechanism for the high sensitivity of the photodetectors has been attributed to the enhanced carrier-separation at the ZnO/C interface. PMID:25502422

  4. The magnetic ordering in high magnetoresistance Mn-doped ZnO thin films

    DOE PAGES

    Venkatesh, S.; Baras, A.; Lee, J. -S.; ...

    2016-03-24

    Here, we studied the nature of magnetic ordering in Mn-doped ZnO thin films that exhibited ferromagnetism at 300 K and superparamagnetism at 5 K. We directly inter-related the magnetisation and magnetoresistance by invoking the polaronpercolation theory and variable range of hopping conduction below the metal-to-insulator transition. By obtaining a qualitative agreement between these two models, we attribute the ferromagnetism to the s-d exchange-induced spin splitting that was indicated by large positive magnetoresistance (~40 %). Low temperature superparamagnetism was attributed to the localization of carriers and non-interacting polaron clusters. This analysis can assist in understanding the presence or absence of ferromagnetismmore » in doped/un-doped ZnO.« less

  5. Nickel-induced microwheel-like surface morphological evolution of ZnO thin films by spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Tarwal, N. L.; Shinde, P. S.; Oh, Y. W.; Cerc Korošec, Romana; Patil, P. S.

    2012-11-01

    Nickel-zinc oxide (Ni-ZnO) thin films were deposited onto glass and tin-doped indium oxide-coated glass substrates by using a pneumatic spray pyrolysis technique at 450 °C from aqueous solutions of zinc acetate and nickel acetate precursors. The effect of nickel doping on structural, morphological and optical properties of the ZnO thin films has been studied. The X-ray diffraction patterns confirmed the polycrystalline nature of the films having hexagonal crystal structure. Ni-ZnO films with appropriate nickel doping revealed the occurrence of novel wheel-like surface morphology. The absorption edge of the Ni-ZnO films showed a red shift, meaning that the optical band gap energy decreases as the nickel doping concentration increases. A growth model is developed and proposed for the novel wheel-like morphology. All the thin films exhibited room-temperature photoluminescence. Pure ZnO and Ni-ZnO thin films were tested for their photoelectrochemical performance in 0.5 M Na2SO4 electrolyte solution. The values of fill factor and open circuit voltage were improved for the Ni-ZnO thin films.

  6. Optical and electrical properties of transparent conducting B-doped ZnO thin films prepared by various deposition methods

    SciTech Connect

    Nomoto, Jun-ichi; Miyata, Toshihiro; Minami, Tadatsugu

    2011-07-15

    B-doped ZnO (BZO) thin films were prepared with various thicknesses up to about 500 nm on glass substrates at 200 deg. C by dc or rf magnetron sputtering deposition, pulsed laser deposition (PLD), and vacuum arc plasma evaporation (VAPE) methods. Resistivities of 4-6 x 10{sup -4}{Omega} cm were obtained in BZO thin films prepared with a B content [B/(B + Zn) atomic ratio] around 1 at. % by PLD and VAPE methods: Hall mobilities above 40 cm{sup 2}/Vs and carrier concentrations on the order of 10{sup 20} cm{sup -3}. All 500-nm-thick-BZO thin films prepared with a resistivity on the order of 10{sup -3}-10{sup -4}{Omega} cm exhibited an averaged transmittance above 80% in the wavelength range of 400-1100 nm. The resistivity in BZO thin films prepared with a thickness below about 500 nm was found to increase over time with exposure to various high humidity environments. In heat-resistance tests, the resistivity stability of BZO thin films was found to be nearly equal to that of Ga-doped ZnO thin films, so these films were judged suitable for use as a transparent electrode for thin-film solar cells.

  7. Microexplosion Recording in Spin-Coated Polymer Films Including ZnO Nanoparticles for Three-Dimensional Optical Memory

    NASA Astrophysics Data System (ADS)

    Shiono, Teruhiro; Yamamoto, Hiroaki; Nishino, Seiji

    2004-07-01

    As a microexplosion recording material, we propose polymer films including ZnO nanoparticles (ZnO polyester composite) for write-once multilayered recording media. These media with the ZnO composite material can be fabricated by a spin-coating method and can be read at the violet wavelength of 0.405 μm. By the electromagnetic analysis of diffraction loss, we clarified the pit design and the optical performance for void formation recording. From the results of experiments performed using three kinds of mode-locked pulsed lasers (pulse widths of 150 fs, 16 ps and 6 ns), with a clear reflection microscope image of submicrometer pits, the microexplosion sensitivity was confirmed to be greatly improved by 14, 38 and 50 times, respectively.

  8. Atomic layer deposition of Nb-doped ZnO for thin film transistors

    NASA Astrophysics Data System (ADS)

    Shaw, A.; Wrench, J. S.; Jin, J. D.; Whittles, T. J.; Mitrovic, I. Z.; Raja, M.; Dhanak, V. R.; Chalker, P. R.; Hall, S.

    2016-11-01

    We present physical and electrical characterization of niobium-doped zinc oxide (NbZnO) for thin film transistor (TFT) applications. The NbZnO films were deposited using atomic layer deposition. X-ray diffraction measurements indicate that the crystallinity of the NbZnO films reduces with an increase in the Nb content and lower deposition temperature. It was confirmed using X-ray photoelectron spectroscopy that Nb5+ is present within the NbZnO matrix. Furthermore, photoluminescence indicates that the band gap of the ZnO increases with a higher Nb content, which is explained by the Burstein-Moss effect. For TFT applications, a growth temperature of 175 °C for 3.8% NbZnO provided the best TFT characteristics with a saturation mobility of 7.9 cm2/Vs, the current On/Off ratio of 1 × 108, and the subthreshold swing of 0.34 V/decade. The transport is seen to follow a multiple-trap and release mechanism at lower gate voltages and percolation thereafter.

  9. Structural and Optical Properties of Group III Doped Hydrothermal ZnO Thin Films

    NASA Astrophysics Data System (ADS)

    Mughal, Asad J.; Carberry, Benjamin; Speck, James S.; Nakamura, Shuji; DenBaars, Steven P.

    2017-01-01

    In this work, we employ a simple two-step growth technique to deposit impurity doped heteroepitaxial thin films of (0001) ZnO onto (111) MgAl2O4 spinel substrates through a combination of atomic layer deposition (ALD) and hydrothermal growth. The hydrothermal layer is doped with Al, Ga, and In through the addition of their respective nitrate salts. We evaluated the effect that varying the concentrations of these dopants has on both the structural and optical properties of these films. It was found that the epitaxial ALD layer created a < 111rangle_{{{{MgAl}}2 {{O}}4 }} | {< 0001rangle_{{ZnO}} } out-of-plane orientation and a < bar{1}bar{1}2rangle_{{{{MgAl}}2 {{O}}4 }} | {< 01bar{1}0rangle_{{ZnO}} } in-plane orientation between the film and substrate. The rocking curve line widths ranged between 0.75° and 1.80° depending on dopant concentration. The optical bandgap determined through the Tauc method was between 3.28 eV and 3.39 eV and showed a Burstein-Moss shift with increasing dopant concentration.

  10. Structural and Optical Properties of Group III Doped Hydrothermal ZnO Thin Films

    NASA Astrophysics Data System (ADS)

    Mughal, Asad J.; Carberry, Benjamin; Speck, James S.; Nakamura, Shuji; DenBaars, Steven P.

    2017-03-01

    In this work, we employ a simple two-step growth technique to deposit impurity doped heteroepitaxial thin films of (0001) ZnO onto (111) MgAl2O4 spinel substrates through a combination of atomic layer deposition (ALD) and hydrothermal growth. The hydrothermal layer is doped with Al, Ga, and In through the addition of their respective nitrate salts. We evaluated the effect that varying the concentrations of these dopants has on both the structural and optical properties of these films. It was found that the epitaxial ALD layer created a < 111rangle_{{{{MgAl}}2 {{O}}4 }} | {< 0001rangle_{{ZnO}} } . out-of-plane orientation and a < bar{1}bar{1}2rangle_{{{{MgAl}}2 {{O}}4 }} | {< 01bar{1}0rangle_{{ZnO}} } . in-plane orientation between the film and substrate. The rocking curve line widths ranged between 0.75° and 1.80° depending on dopant concentration. The optical bandgap determined through the Tauc method was between 3.28 eV and 3.39 eV and showed a Burstein-Moss shift with increasing dopant concentration.

  11. Effects of annealing pressure and Ar+ sputtering cleaning on Al-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Wang, Jiwei; Mei, Yong; Lu, Xuemei; Fan, Xiaoxing; Kang, Dawei; Xu, Panfeng; Tan, Tianya

    2016-11-01

    Post-treatments of Al-doped ZnO films fabricated by sol-gel method were studied in condition of annealing in air, vacuum and protective ambient, as well as the follow-up Ar+ sputtering cleaning. The effect of annealing pressure on resistivity of AZO films was investigated from 105 to 10-4 Pa, where the resistivity decreased four orders of magnitude as the pressure decreased and approached to its minimum at 10 Pa. It was observed that the main decreasing of resistivity occurred in a very narrow range of middle vacuum (between 100 and 10 Pa) and high vacuum was dispensable. The XRD and XPS characterizations demonstrated that the radical increasing of oxygen vacancy, Zn interstitial and substitution of Al3+ for Zn2+ under middle vacuum were responsible for the significant enhancement of conductivity. The follow-up Ar+ sputtering cleaning can further decrease the resistivity through removing the chemisorbed oxygen on film surface and grain boundaries, meanwhile fulfil the surface texture process, and thus improve both electrical and optical performances for applications.

  12. Co thin films deposited directly on ZnO polar surfaces

    PubMed Central

    Chiba, Daichi; Shibata, Naoya; Tsukazaki, Atsushi

    2016-01-01

    A ferromagnetic (FM)-metal/oxide stack is the key structure determining the performance of spintronic devices. However, the effect of the electronic polarity of the oxide on the magnetic properties of the adjacent FM-metal has not been investigated previously. Here, we report the magnetic and structural properties of Co ultra-thin films sputter deposited directly on the Zn- and O-polar surfaces of ZnO substrates. The magnetic anisotropy and Curie temperature exhibit dramatic polarity-dependent differences for films on these surfaces. Structural analyses reveal that the heterointerface of the Co/O-polar surface is rather diffusive, whereas that of the Co/Zn-polar surface is atomically flat. These results suggest that the surface polarity plays a key role in determining the properties of the film. This novel FM-metal/polar-oxide system is expected to add new functionality to spintronic devices and provide an ideal basis for investigating the effect of a built-in electric field on the magnetism in a metallic monolayer. PMID:27897251

  13. An economic approach to fabricate photo sensor based on nanostructured ZnO thin films

    NASA Astrophysics Data System (ADS)

    Huse, Nanasaheb; Upadhye, Deepak; Sharma, Ramphal

    2016-05-01

    Nanostructural ZnO Thin Films have been synthesized by simple and economic Chemical Bath Deposition technique onto glass substrate with bath temperature at 60°C for 1 hour. Structural, Optical, Electrical and topographical properties of the prepared Thin Films were investigated by GIXRD, I-V Measurement System, UV-Visible Spectrophotometer and AFM respectively. Calculated lattice parameters are in good agreement with the standard JCPDS card (36-1451) values, exhibits Hexagonal Wurtzite crystal structure. I-V Measurement curve has shown ohmic nature in dark condition and responds to light illumination which reveals Photo sensor properties. After illumination of 60W light, decrease in resistance was observed from 110.9 KΩ to 104.4 KΩ. The change in current and calculated Photo sensitivity was found to be 3.51 µA and 6.3% respectively. Optical band gap was found to be 3.24 eV. AFM images revealed uniform deposition over entire glass substrate with 32.27 nm average roughness of the film.

  14. Effect of GaN interlayer on polarity control of epitaxial ZnO thin films grown by molecular beam epitaxy

    SciTech Connect

    Wang, X. Q.; Sun, H. P.; Pan, X. Q.

    2010-10-11

    Epitaxial ZnO thin films were grown on nitrided (0001) sapphire substrates with an intervening GaN layer by rf-plasma-assisted molecular beam epitaxy. It was found that polarity of the ZnO epilayer could be controlled by modifying the GaN interlayer. ZnO grown on a distorted 3-nm-thick GaN interlayer has Zn-polarity while ZnO on a 20-nm-thick GaN interlayer with a high structural quality has O-polarity. High resolution transmission electron microscopy analysis indicates that the polarity of ZnO epilayer is controlled by the atomic structure of the interface between the ZnO buffer layer and the intervening GaN layer.

  15. Surface nanostructuring of thin film composite membranes via grafting polymerization and incorporation of ZnO nanoparticles

    NASA Astrophysics Data System (ADS)

    Isawi, Heba; El-Sayed, Magdi H.; Feng, Xianshe; Shawky, Hosam; Abdel Mottaleb, Mohamed S.

    2016-11-01

    A new approach for modification of polyamid thin film composite membrane PA(TFC) using synthesized ZnO nanoparticles (ZnO NPs) was shown to enhance the membrane performances for reverse osmosis water desalination. First, active layer of synthesis PA(TFC) membrane was activated with an aqueous solution of free radical graft polymerization of hydrophilic methacrylic acid (MAA) monomer onto the surface of the PA(TFC) membrane resulting PMAA-g-PA(TFC). Second, the PA(TFC) membrane has been developed by incorporation of ZnO NPs into the MAA grafting solution resulting the ZnO NPs modified PMAA-g-PA(TFC) membrane. The surface properties of the synthesized nanoparticles and prepared membranes were investigated using the FTIR, XRD and SEM. Morphology studies demonstrated that ZnO NPs have been successfully incorporated into the active grafting layer over PA(TFC) composite membranes. The zinc leaching from the ZnO NPs modified PMAA-g-PA(TFC) was minimal, as shown by batch tests that indicated stabilization of the ZnO NPs on the membrane surfaces. Compared with the a pure PA(TFC) and PMAA-g-PA(TFC) membranes, the ZnO NPs modified PMAA-g-PA(TFC) was more hydrophilic, with an improved water contact angle (∼50 ± 3°) over the PMAA-g-PA(TFC) (63 ± 2.5°). The ZnO NPs modified PMAA-g-PA(TFC) membrane showed salt rejection of 97% (of the total groundwater salinity), 99% of dissolved bivalent ions (Ca2+, SO42-and Mg2+), and 98% of mono valent ions constituents (Cl- and Na+). In addition, antifouling performance of the membranes was determined using E. coli as a potential foulant. This demonstrates that the ZnO NPs modified PMAA-g-PA(TFC) membrane can significantly improve the membrane performances and was favorable to enhance the selectivity, permeability, water flux, mechanical properties and the bio-antifouling properties of the membranes for water desalination.

  16. Dopant-induced bandgap shift in Al-doped ZnO thin films prepared by spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Hung-Chun Lai, Henry; Basheer, Tahseen; Kuznetsov, Vladimir L.; Egdell, Russell G.; Jacobs, Robert M. J.; Pepper, Michael; Edwards, Peter P.

    2012-10-01

    A series of 1 at. % Al-doped ZnO (AZO) films were deposited onto glass substrates by a spray pyrolysis technique. We find that the observed blue shift in the optical bandgap of 1% AZO films is dominated by the Burstein Moss effect. The Fermi level for an 807 nm thick AZO film rose by some 0.16 eV with respect to the edge of the conduction band. By controlling the film thickness, all AZO films exhibit the same lattice strain values. The influence of strain-induced bandgap shift was excluded by selecting films with nearly the same level of bandgap volume-deformation potentials, and the differences in out-plain strain and in-plain stress remained effectively constant.

  17. Reversible Change in Electrical and Optical Properties in Epitaxially Grown Al-Doped ZnO Thin Films

    SciTech Connect

    Noh, J. H.; Jung, H. S.; Lee, J. K.; Kim, J. Y; Cho, C. M.; An, J.; Hong, K. S.

    2008-01-01

    Aluminum-doped ZnO (AZO) films were epitaxially grown on sapphire (0001) substrates using pulsed laser deposition. As-deposited AZO films had a low resistivity of 8.01 x 10{sup -4} {Omega} cm. However, after annealing at 450 C in air, the electrical resistivity of the AZO films increased to 1.97 x 10{sup -1} {Omega} cm because of a decrease in the carrier concentration. Subsequent annealing of the air-annealed AZO films in H{sub 2} recovered the electrical conductivity of the AZO films. In addition, the conductivity change was reversible upon repeated air and H{sub 2} annealing. A photoluminescence study showed that oxygen interstitial (O{sub i}) is a critical material parameter allowing for the reversible control of the electrical conducting properties of AZO films.

  18. Modification of opto-electronic properties of ZnO by incorporating metallic tin for buffer layer in thin film solar cells

    SciTech Connect

    Deepu, D. R.; Jubimol, J.; Kartha, C. Sudha; Louis, Godfrey; Vijayakumar, K. P.; Kumar, K. Rajeev

    2015-06-24

    In this report, the effect of incorporation of metallic tin (Sn) on opto-electronic properties of ZnO thin films is presented. ZnO thin films were deposited through ‘automated chemical spray pyrolysis’ (CSP) technique; later different quantities of ‘Sn’ were evaporated on it and subsequently annealed. Vacuum annealing showed a positive effect on crystallinity of films. Creation of sub band gap levels due to ‘Sn’ diffusion was evident from the absorption and PL spectra. The tin incorporated films showed good photo response in visible region. Tin incorporated ZnO thin films seem to satisfy the desirable criteria for buffer layer in thin film solar cells.

  19. Transparent conducting impurity-doped ZnO thin films prepared using oxide targets sintered by millimeter-wave heating

    SciTech Connect

    Minami, Tadatsugu; Okada, Kenji; Miyata, Toshihiro; Nomoto, Juni-chi; Hara, Youhei; Abe, Hiroshi

    2009-07-15

    The preparation of transparent conducting impurity-doped ZnO thin films by both pulsed laser deposition (PLD) and magnetron sputtering deposition (MSD) using impurity-doped ZnO targets sintered with a newly developed energy saving millimeter-wave (28 GHz) heating technique is described. Al-doped ZnO (AZO) and V-co-doped AZO (AZO:V) targets were prepared by sintering with various impurity contents for 30 min at a temperature of approximately 1250 degree sign C in an air or Ar gas atmosphere using the millimeter-wave heating technique. The resulting resistivity and its thickness dependence obtainable in thin films prepared by PLD using millimeter-wave-sintered AZO targets were comparable to those obtained in thin films prepared by PLD using conventional furnace-sintered AZO targets; a low resistivity on the order of 3x10{sup -4} {Omega} cm was obtained in AZO thin films prepared with an Al content [Al/(Al+Zn) atomic ratio] of 3.2 at. % and a thickness of 100 nm. In addition, the resulting resistivity and its spatial distribution on the substrate surface obtainable in thin films prepared by rf-MSD using a millimeter-wave-sintered AZO target were almost the same as those obtained in thin films prepared by rf-MSD using a conventional powder AZO target. Thin films prepared by PLD using millimeter-wave-sintered AZO:V targets exhibited an improved resistivity stability in a high humidity environment. Thin films deposited with a thickness of approximately 100 nm using an AZO:V target codoped with an Al content of 4 at. % and a V content [V/(V+Zn) atomic ratio] of 0.2 at. % were sufficiently stable when long-term tested in air at 90% relative humidity and 60 degree sign C.

  20. Microstructural and Optical properties of transition metal (Cu) doped ZnO diluted magnetic semiconductor nano thin films fabricated by sol gel method

    NASA Astrophysics Data System (ADS)

    Ozturk, Ozgur; Asikuzun, Elif; Tasci, A. Tolga; Arda, Lutfi; Demirozu Senol, Sevim; Celik, Sukru; Terzioglu, Cabir

    Undoped and Cu (Copper) doped ZnO (Zn1-xCuxO) semiconductor thin films were produced by using sol-gel method. Cu was doped 1%, 2%, 3%, 4% and 5% ratio. Methanol and monoethanolamine (MEA) were used as solvent and stabilizer. In this study, the effect of Cu doping was investigated on microstructural and optical properties of ZnO DMS thin films. XRD, SEM, AFM and UV-VIS spectrometer measurements were performed for the microstructural and optical characterization. XRD, SEM and AFM results were showed that all of Cu doped ZnO based thin films have a hexagonal structure. The grain size of Cu doped ZnO thin films and morphology of surface were changed with increasing Cu doping. The optical transmittance of transition metal (Cu) doped ZnO thin films were decreased with doping. Keywords:Diluted Magnetic Semiconductor (DMS), Thin Film, Cu-doping, Bandgap Energy, ZnO. This research has been supported by the Kastamonu University Scientific Research Projects Coordination Department under the Grant No. KU-BAP-05/2015-12 and the Scientific and Technological Research Council of Turkey (TUBITAK) Project No. 114F259.

  1. Synthesis of amorphous TiO2 modified ZnO nanorod film with enhanced photocatalytic properties

    NASA Astrophysics Data System (ADS)

    Xiao, Shanshan; Zhao, Lei; Leng, Xuning; Lang, Xingyou; Lian, Jianshe

    2014-04-01

    Amorphous TiO2 modified ZnO nanorod films were synthesized via multi-step processes: ZnO nanorod films were prepared by a wet chemical method. Amorphous TiO2 was then anchored on the tops and sides of the nanorods through immersion in tetrabutyltitanate solution for hydrolysis. The as-prepared samples were characterized for the phase structure, chemical state and surface morphology as well as optical absorption using X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), and ultraviolet-visible (UV-vis) spectrophotometer. The results showed that the nanorod films were covered by amorphous TiO2 layers, and their visible light absorption ability was strengthened. The photocatalytic studies revealed that TiO2 modified films exhibited enhanced photocatalytic efficiency for decomposition of methyl orange under ultraviolet-visible excitation, which might be attributed to the increased UV-vis light absorption and the separation of the charge carrier and prolonged electron lifetime due to the interface between TiO2 and ZnO.

  2. Reducing adhesion force by means of atomic layer deposition of ZnO films with nanoscale surface roughness.

    PubMed

    Chai, Zhimin; Liu, Yuhong; Lu, Xinchun; He, Dannong

    2014-03-12

    Adhesion is a big concern for the design of Si-based microelectromechanical devices. A ZnO film with nanoscale surface roughness is a promising candidate to decrease adhesion as the protective coating. In this study, the adhesion force of ZnO films prepared by atomic layer deposition (ALD) on a Si (100) substrate was studied. The root-mean-square (RMS) roughness of the ZnO films was in the range of 0.7-4.28 nm, and the contact angle of water was in the range of 85-88°. The adhesion force was measured by atomic force microscopy (AFM) at both low (12%) and high (60%) relative humidities. The results show that the adhesion force decreases as the surface roughness increases. A low adhesion force at high RMS roughness is attributed to the large asperities on the film, and a large adhesion force at high humidity is attributed to the large capillary force. The experimental adhesion force was compared to the force calculated using the Rabinovich model. Although the theoretical value underestimates the experimental value, the proportion of the two components of the adhesion force is clearly shown. At the low humidity, the van der Waals force component differs not greatly with the capillary force component, while at the high humidity, the capillary force component becomes dominant.

  3. Swift heavy ion induced optical and structural modifications in RF sputtered nanocrystalline ZnO thin film

    NASA Astrophysics Data System (ADS)

    Singh, S. K.; Singhal, R.; Vishnoi, R.; Kumar, V. V. S.; Kulariya, P. K.

    2017-01-01

    In the present study, 100 MeV Ag7+ ion beam-induced structural and optical modifications of nanocrystalline ZnO thin films are investigated. The nanocrystalline ZnO thin films are grown using radio frequency magnetron sputtering and irradiated at fluences of 3 × 1012, 1 × 1013 and 3 × 1013 ions/cm2. The incident swift heavy ions induced change in the crystallinity together with the preferential growth of crystallite size along the c axis (002) orientation. The average crystallite size is found to be increased from 10.8 ± 0.7 to 20.5 ± 0.3 nm with increasing the ion fluence. The Atomic force microscopy analysis confirms the variation in the surface roughness by varying the incident ion fluences. The UV-visible spectroscopy shows the decrement in transmittance of the film with ion irradiation. The micro-Raman spectra of ZnO thin films are investigated to observe ion-induced modifications which support the increased lattice defects with higher fluence. The variation in crystallinity indicates that ZnO-based devices can be used in piezoelectric transduction mechanism.

  4. Influence of annealing conditions on the crystallographic structure, chemical composition and luminescence of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Khojier, K.; Savaloni, H.; Amani, E.

    2014-01-01

    ZnO thin films have many applications in semiconductor devices, such as semiconductor lasers, amplifiers, solar cells, chemical and ultraviolet sensors. We produced ZnO thin films on Si (4 0 0) substrates, using e-beam technique and subsequently annealed them under different conditions (i.e., temperature (200-800), time (60 min and 180 min) and environment (air and oxygen flow). The ZnO (0 0 2) preferred orientation which increases in intensity with annealing temperature and annealing time is deduced from X-ray diffraction (XRD) results. Dislocation density was higher for the films annealed in air which may be caused by the impurities (nitrogen and other species in the air) embedded in the film structure. No significant change in the nano-strain of each group of the samples (annealed under different conditions) was observed. The FESEM images showed a granular structure for annealed samples at 200 °C and 800 °C and a mixed structure of nanowires and nanosheets for samples annealed at 350 °C and 500 °C. Two peaks of UV emission and green emission were observed in the photoluminescence (PL) spectra of the produced samples. The UV emission increased with annealing temperature and annealing time showing higher crystal quality while the behavior of the green emission was opposite to that of the UV emission. The ZnO films resulted from annealing in the air showed stronger green emission than those annealed with flow of oxygen indicating higher impurity concentration and oxygen vacancies in the sample.

  5. Acoustoelectric Effect on the Responses of SAW Sensors Coated with Electrospun ZnO Nanostructured Thin Film

    PubMed Central

    Tasaltin, Cihat; Ebeoglu, Mehmet Ali; Ozturk, Zafer Ziya

    2012-01-01

    In this study, zinc oxide (ZnO) was a very good candidate for improving the sensitivity of gas sensor technology. The preparation of an electrospun ZnO nanostructured thin film on a 433 MHz Rayleigh wave based Surface Acoustic Wave (SAW) sensor and the investigation of the acoustoelectric effect on the responses of the SAW sensor are reported. We prepared an electrospun ZnO nanostructured thin film on the SAW devices by using an electrospray technique. To investigate the dependency of the sensor response on the structure and the number of the ZnO nanoparticles, SAW sensors were prepared with different coating loads. The coating frequency shifts were adjusted to fall between 100 kHz and 2.4 MHz. The sensor measurements were performed against VOCs such as acetone, trichloroethylene, chloroform, ethanol, n-propanol and methanol vapor. The sensor responses of n-propanol have opposite characteristics to the other VOCs, and we attributed these characteristics to the elastic effect/acoustoelectric effect.

  6. Mechanical, structural and thermal properties of Ag-Cu and ZnO reinforced polylactide nanocomposite films.

    PubMed

    Ahmed, Jasim; Arfat, Yasir Ali; Castro-Aguirre, Edgar; Auras, Rafael

    2016-05-01

    Plasticized polylactic acid (PLA) based nanocomposite films were prepared by incorporating polyethylene glycol (PEG) and two selected nanoparticles (NPs) [silver-copper (Ag-Cu) alloy (<100 nm) and zinc oxide (ZnO) (<50 and <100 nm)] through solvent casting method. Incorporation of Ag-Cu alloy into the PLA/PEG matrix increased the glass transition temperature (Tg) significantly. The crystallinity of the nanocomposites (NCs) was significantly influenced by NP incorporation as evidenced from differential scanning calorimetry (DSC) and X-ray diffraction (XRD) analysis. The PLA nanocomposite reinforced with NPs exhibited much higher tensile strength than that of PLA/PEG blend. Melt rheology of NCs exhibited a shear-thinning behavior. The mechanical property drastically reduced with a loading of NPs, which is associated with degradation of PLA. SEM micrographs exhibited that both Ag-Cu alloy and ZnO NPs were dispersed well in the PLA film matrix.

  7. Room temperature radio-frequency plasma-enhanced pulsed laser deposition of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Huang, S.-H.; Chou, Y.-C.; Chou, C.-M.; Hsiao, V. K. S.

    2013-02-01

    In this study, we compared the crystalline structures, optical properties, and surface morphologies of ZnO thin films deposited on silicon and glass substrates by conventional pulsed laser deposition (PLD) and radio-frequency (RF) plasma-enhanced PLD (RF-PEPLD). The depositions were performed at room temperature under 30-100 mTorr pressure conditions. The RF-PEPLD process was found to have deposited a ZnO structure with preferred (0 0 2) c-axis orientation at a higher deposition rate; however, the RF-PEPLD process generated more defects in the thin films. The application of oxygen pressure to the RF-PEPLD process reduced defects effectively and also increased the deposition rate.

  8. Hybrid ZnO nanowire/a-Si:H thin-film radial junction solar cells using nanoparticle front contacts

    SciTech Connect

    Pathirane, M. Iheanacho, B.; Lee, C.-H.; Wong, W. S.; Tamang, A.; Knipp, D.; Lujan, R.

    2015-10-05

    Hydrothermally synthesized disordered ZnO nanowires were conformally coated with a-Si:H thin-films to fabricate three dimensional hybrid nanowire/thin-film structures. The a-Si:H layer formed a radial junction p-i-n diode solar cell around the ZnO nanowire. The cylindrical hybrid solar cells enhanced light scattering throughout the UV-visible-NIR spectrum (300 nm–800 nm) resulting in a 22% increase in short-circuit current density compared to the reference planar p-i-n device. A fill factor of 69% and a total power conversion efficiency of 6.5% were achieved with the hybrid nanowire solar cells using a spin-on indium tin oxide nanoparticle suspension as the top contact.

  9. Mango core inner shell membrane template-directed synthesis of porous ZnO films and their application for enzymatic glucose biosensor

    NASA Astrophysics Data System (ADS)

    Zhou, Yu; Wang, Lei; Ye, Zhizhen; Zhao, Minggang; Cai, Hui; Huang, Jingyun

    2013-11-01

    Micro/nano-porous ZnO films were synthesized through a simple biotemplate-directed method using mango core inner shell membranes as templates. The achieved ZnO films with wrinkles on the surface are combined of large holes and small pores in the bulk. High specific surface area, numerous microspaces, and small channels for fluid circulation provided by this unique structure along with the good biocompatibility and electron communication features of ZnO material make the product an ideal platform for the immobilization of enzymes The fabricated glucose biosensor based on the porous ZnO films exhibits good selective detection ability of analyte with good stability, high sensitivity of 50.58 μA cm-2 mM-1 and a wide linear range of 0.2-5.6 mM along with a low detection limit of 10 μM.

  10. ZnO homojunction photodiodes based on Sb-doped p-type nanowire array and n-type film for ultraviolet detection

    SciTech Connect

    Wang Guoping; Chu Sheng; Zhan Ning; Liu Jianlin; Lin Yuqing; Chernyak, Leonid

    2011-01-24

    ZnO p-n homojunctions based on Sb-doped p-type nanowire array and n-type film were grown by combining chemical vapor deposition (for nanowires) with molecular-beam epitaxy (for film). Indium tin oxide and Ti/Au were used as contacts to the ZnO nanowires and film, respectively. Characteristics of field-effect transistors using ZnO nanowires as channels indicate p-type conductivity of the nanowires. Electron beam induced current profiling confirmed the existence of ZnO p-n homojunction. Rectifying I-V characteristic showed a turn-on voltage of around 3 V. Very good response to ultraviolet light illumination was observed from photocurrent measurements.

  11. Effect of Fe incorporation on the optical behavior of ZnO thin films prepared by sol-gel derived spin coating techniques

    NASA Astrophysics Data System (ADS)

    Rakkesh, R. Ajay; Malathi, R.; Balakumar, S.

    2013-02-01

    In this work, Fe doped Zinc Oxide (ZnO) thin films were fabricated on the glass substrate by sol-gel derived spin coating technique. X-ray Diffraction studies revealed that the obtained pure and Fe doped ZnO thin films were in the wurtzite and spinel phase respectively. The three well defined Raman lines at 432, 543 and 1091 cm-1 also confirmed the lattice structure of the ZnO thin film has wurtzite symmetry. While doping Fe atoms in the ZnO, there was a significant change in the phase from wurtzite to spinel structure; owing to Fe (III) ions being incorporated into the lattice through substitution of Zn (II) ions. Room temperature PL spectra showed that the role of defect mediated red emissions at 612 nm was due to radial recombination of a photogenerated hole with an electron that belongs to the Fe atoms, which were discussed in detail.

  12. Electroless plating of thin gold films directly onto silicon nitride thin films and into micropores.

    PubMed

    Whelan, Julie C; Karawdeniya, Buddini Iroshika; Bandara, Y M Nuwan D Y; Velleco, Brian D; Masterson, Caitlin M; Dwyer, Jason R

    2014-07-23

    A method to directly electrolessly plate silicon-rich silicon nitride with thin gold films was developed and characterized. Films with thicknesses <100 nm were grown at 3 and 10 °C between 0.5 and 3 h, with mean grain sizes between ∼20 and 30 nm. The method is compatible with plating free-standing ultrathin silicon nitride membranes, and we successfully plated the interior walls of micropore arrays in 200 nm thick silicon nitride membranes. The method is thus amenable to coating planar, curved, and line-of-sight-obscured silicon nitride surfaces.

  13. Characterization of ZnO thin films grown on different p-Si substrate elaborated by solgel spin-coating method

    SciTech Connect

    Chebil, W.; Fouzri, A.; Fargi, A.; Azeza, B.; Zaaboub, Z.; and others

    2015-10-15

    Highlights: • High quality ZnO thin films grown on different p-Si substrates were successful obtained by sol–gel process. • PL measurement revealed that ZnO thin film grown on porous Si has the better optical quality. • I–V characteristics for all heterojunctions exhibit successful diode formation. • The diode ZnO/PSi shows a better photovoltaic effect under illumination with a maximum {sub Voc} of 0.2 V. - Abstract: In this study, ZnO thin films are deposited by sol–gel technique on p-type crystalline silicon (Si) with [100] orientation, etched silicon and porous silicon. The structural analyses showed that the obtained thin films were polycrystalline with a hexagonal wurtzite structure and preferentially oriented along the c-axis direction. Morphological study revealed the presence of rounded and facetted grains irregularly distributed on the surface of all samples. PL spectra at room temperature revealed that ZnO thin film grown on porous Si has a strong UV emission with low defects in the visible region comparing with ZnO grown on plat Si and etched Si surface. The heterojunction parameters were evaluated from the (I–V) under dark and illumination at room temperature. The ideality factor, barrier height and series resistance of heterojunction grown on different p-Si substrates are determined by using different methods. Best electrical properties are obtained for ZnO layer deposited on porous silicon.

  14. Research Update: Atmospheric pressure spatial atomic layer deposition of ZnO thin films: Reactors, doping, and devices

    SciTech Connect

    Hoye, Robert L. Z. E-mail: jld35@cam.ac.uk; MacManus-Driscoll, Judith L. E-mail: jld35@cam.ac.uk; Muñoz-Rojas, David; Nelson, Shelby F.; Illiberi, Andrea; Poodt, Paul

    2015-04-01

    Atmospheric pressure spatial atomic layer deposition (AP-SALD) has recently emerged as an appealing technique for rapidly producing high quality oxides. Here, we focus on the use of AP-SALD to deposit functional ZnO thin films, particularly on the reactors used, the film properties, and the dopants that have been studied. We highlight how these films are advantageous for the performance of solar cells, organometal halide perovskite light emitting diodes, and thin-film transistors. Future AP-SALD technology will enable the commercial processing of thin films over large areas on a sheet-to-sheet and roll-to-roll basis, with new reactor designs emerging for flexible plastic and paper electronics.

  15. Surfactant mediated one- and two-dimensional ZnO nanostructured thin films for dye sensitized solar cell application

    NASA Astrophysics Data System (ADS)

    Marimuthu, T.; Anandhan, N.; Thangamuthu, R.; Mummoorthi, M.; Rajendran, S.; Ravi, G.

    2015-01-01

    One-dimensional (1D) and two-dimensional (2D) nanostructured zinc oxide (ZnO) thin films were electrodeposited from aqueous zinc chloride on FTO glass substrates. The effects of organic surfactant such as cetyltrimethyl ammonium bromide (CTAB) and polyvinyl alcohol (PVA) on structural, morphological, crystal quality and optical properties of electrodeposited ZnO films were investigated. The x-ray diffraction pattern revealed that the prepared thin films were pure wutrzite hexagonal structure. The thin films deposited using organic surfactant in this work showed different morphologies such as nanoplatelet and flower. The hexagonal platelet and flower-like nanostructures were obtained in the presence of CTAB and PVA surfactant, respectively. The crystal quality and atomic vacancies of the prepared nanostructured thin films were investigated by micro Raman spectroscopic technique. The emission properties and optical quality of the films were studied by photoluminescence spectrometry. PEMA-LiClO4-EC gel polymer electrolyte has been used to replace the liquid electrolyte for reducing the leakage problem. Graphene counter electrode was used as an alternative for platinum electrode. Eosin yellow dye was used as a sensitizer. J-V characterizations were carried out for different 1D and 2D nanostructures. The nanoflower structure exhibited higher efficiency (η = 0.073%) than the other two nanostructures.

  16. Investigation of the interrelation between the chemical state and the electric properties in Al-doped ZnO films

    NASA Astrophysics Data System (ADS)

    Wang, Jinzhao; Ni, Dongfang; Zhang, Tianjin; Wang, Duofa; Liang, Kun

    2015-09-01

    Transparent conducting Al-doped ZnO (AZO) thin films were prepared on glass substrates by radio frequency magnetron sputtering in pure Ar. The influence of the annealing atmosphere on the microstructure, chemical state, electric and optical properties of the AZO films was investigated with X-ray diffraction, field-emission scanning electron microscopy, X-ray photoelectron spectroscopy and Hall measurements. The AZO thin films annealed under vacuum had the highest carrier concentration of 2.488 × 1020 cm-3 and a Hall mobility of 16.35 cm2 V-1 s-1, while the AZO thin films annealed in air had the lowest carrier concentration of 4.182 × 1017 cm-3 and a Hall mobility of 2.375 cm2 V-1 s-1. The fitted narrow-scan O1 s spectra revealed that O1 s was composed of three components. The AZO thin films annealed under vacuum appeared to have a higher proportion of medium binding energy which correspond to O2- ions in the oxygen-deficient regions within the ZnO matrix, and have a lower proportion of high binding energy component which correspond to loosely bound chemisorbed oxygen. It believed that the oxygen vacancies and chemisorbed oxygen of the films played an important role in the electrical conductance. The carrier concentration increased with the formation of oxygen vacancies. The Hall mobility increased with desorption of the loosely bound oxygen.

  17. Preparation and characterization of n-type conductive (Al, Co) co-doped ZnO thin films deposited by sputtering from aerogel nanopowders

    NASA Astrophysics Data System (ADS)

    El Mir, L.; Ayadi, Z. Ben; Saadoun, M.; Djessas, K.; von Bardeleben, H. J.; Alaya, S.

    2007-11-01

    Highly transparent, n-type conducting ZnO thin films were obtained by low temperature magnetron sputtering of (Co, Al) co-doped ZnO nanocrystalline aerogels. The nanoparticles of ˜30 nm size were synthesized by a sol-gel method using supercritical drying in ethyl alcohol. The structural, optical and electrical properties of the films were investigated. The ZnO films were polycrystalline textured, preferentially oriented with the (0 0 2) crystallographic direction normal to the film plane. The films show within the visible wavelength region an optical transmittance of more than 90% and a low electrical resistivity of 3.5 × 10 -4 Ω cm at room temperature.

  18. Photo-Patternable ZnO Thin Films Based on Cross-Linked Zinc Acrylate for Organic/Inorganic Hybrid Complementary Inverters.

    PubMed

    Jeong, Yong Jin; An, Tae Kyu; Yun, Dong-Jin; Kim, Lae Ho; Park, Seonuk; Kim, Yebyeol; Nam, Sooji; Lee, Keun Hyung; Kim, Se Hyun; Jang, Jaeyoung; Park, Chan Eon

    2016-03-02

    Complementary inverters consisting of p-type organic and n-type metal oxide semiconductors have received considerable attention as key elements for realizing low-cost and large-area future electronics. Solution-processed ZnO thin-film transistors (TFTs) have great potential for use in hybrid complementary inverters as n-type load transistors because of the low cost of their fabrication process and natural abundance of active materials. The integration of a single ZnO TFT into an inverter requires the development of a simple patterning method as an alternative to conventional time-consuming and complicated photolithography techniques. In this study, we used a photocurable polymer precursor, zinc acrylate (or zinc diacrylate, ZDA), to conveniently fabricate photopatternable ZnO thin films for use as the active layers of n-type ZnO TFTs. UV-irradiated ZDA thin films became insoluble in developing solvent as the acrylate moiety photo-cross-linked; therefore, we were able to successfully photopattern solution-processed ZDA thin films using UV light. We studied the effects of addition of a tiny amount of indium dopant on the transistor characteristics of the photopatterned ZnO thin films and demonstrated low-voltage operation of the ZnO TFTs within ±3 V by utilizing Al2O3/TiO2 laminate thin films or ion-gels as gate dielectrics. By combining the ZnO TFTs with p-type pentacene TFTs, we successfully fabricated organic/inorganic hybrid complementary inverters using solution-processed and photopatterned ZnO TFTs.

  19. Enhancement of crystallinity and optical properties of bilayer TiO2/ZnO thin films prepared by atomic layer deposition.

    PubMed

    Hussin, Rosniza; Choy, Kwang-Leong; Hou, Xianghui

    2011-09-01

    Bilayer and multilayer thin films are becoming increasingly important in the development of faster, smaller and more efficient electronic and optoelectronic devices. One of the motivations of applying bilayer or multilayer structures is to modify the optical properties of materials. Atomic layer deposition (ALD) is a variant of Chemical Vapour Deposition that can produce uniform and conformal thin films with well controlled nanostructures. In this study, we have demonstrated new findings of the use of ALD fabricated bilayer TiO2/ZnO thin films with enhanced crystallinity and optical properties. TiO2 films have been deposited at 300 degrees C for 1000 (51 nm in thickness) or 3000 (161 nm in thickness) deposition cycles onto glass and Si substrates. ZnO films are subsequently deposited on the TiO2 layers at 280 degrees C for 500 deposition cycles (55 nm). The crystallinity and optical properties of the TiO2/ZnO thin films have been analysed by X-ray diffraction, photoluminescence, UV-Vis spectroscopy, Atomic Force Microscopy and Scanning Electron Microscopy. XRD diffraction pattern confirmed the presence of ZnO with wutrtize crystal structure and TiO2 with anatase structure. It shows that the crystallinity of the TiO2 films has been improved with the deposition of ZnO. The intensity of UV luminescence has increased by almost 30% for TiO2/ZnO bilayer as compared to the single layer TiO2. The possible mechanism for the enhancement of the optical properties of bilayer TiO2/ZnO thin films will be discussed.

  20. Growth stimulation of Bacillus cereus and Pseudomonas putida using nanostructured ZnO thin film as transducer element

    NASA Astrophysics Data System (ADS)

    Loukanov, Alexandre; Filipov, Chavdar; Valcheva, Violeta; Lecheva, Marta; Emin, Saim

    2015-04-01

    The semiconductor zinc oxide nanomaterial (ZnO or ZnO:H) is widely used in advanced biosensor technology for the design of highly-sensitive detector elements for various applications. In the attempt to evaluate its effect on common microorganisms, two types of nanostructured transducer films have been used (average diameter 600-1000 nm). They have been prepared by using both wet sol-gel method and magnetron sputtering. Their polycrystalline structure and specific surface features have been analyzed by X-ray diffraction (XRD), scanning electron microscope, and atomic force microscope. The assessment of growth stimulation of bacteria was determined using epifluorescent microscope by cell staining with Live/Dead BacLight kit. In our experiments, the growth stimulation of Gram-positive and Gram-negative bacteria on nanostructured ZnO film is demonstrated by Bacillus cereus and Pseudomonas putida. These two bacterial species have been selected, because they are well known and studied in biosensor technologies, with structural difference of their cell walls. These pathogens are easy for with common source in the liquid food or some commercial products. Our data has revealed that the method of transducer film preparation influences strongly bacterial inhibition and division. These results present the transforming signal precisely, when ZnO is used in biosensor applications.

  1. Effect of the gate metal work function on water-gated ZnO thin-film transistor performance

    NASA Astrophysics Data System (ADS)

    Singh, Mandeep; Yusuf Mulla, Mohammad; Vittoria Santacroce, Maria; Magliulo, Maria; Di Franco, Cinzia; Manoli, Kyriaki; Altamura, Davide; Giannini, Cinzia; Cioffi, Nicola; Palazzo, Gerardo; Scamarcio, Gaetano; Torsi, Luisa

    2016-07-01

    ZnO thin films, prepared using a printing-compatible sol-gel method involving a thermal treatment below 400 °C, are proposed as active layers in water-gated thin-film transistors (WG-TFTs). The thin-film structure and surface morphology reveal the presence of contiguous ZnO crystalline (hexagonal wurtzite) with isotropic nano-grains as large as 10 nm characterized by a preferential orientation along the a-axis. The TFT devices are gated through a droplet of deionized water by means of electrodes characterized by different work functions. The high capacitance of the electrolyte allowed operation below 0.5 V. While the Ni, Pd, Au and Pt gate electrodes are electrochemically stable in the inspected potential range, electrochemical activity is revealed for the W one. Such an occurrence leads to an increase of capacitance (and current), which is ascribed to a high output current from the dissolution of a lower capacitance W-oxide layer. The environmental stability of the ZnO WG-TFTs is quite good over a period of five months.

  2. Properties of atomic-layer-deposited Al2O3/ZnO dielectric films grown at low temperature for RF MEMS

    NASA Astrophysics Data System (ADS)

    Herrmann, Cari F.; Del Rio, Frank W.; George, Steven M.; Bright, Victor M.

    2005-01-01

    Al2O3/ZnO alloy films were grown at 100°C using atomic layer deposition (ALD) techniques. It has been previously established that the resistivity of these films can be tuned over a wide range by varying the amount of Zn in the film. Al2O3/ZnO ALD alloy films can therefore be designed with a dielectric constant high enough to provide a large down-state capacitance and a resistivity low enough to promote the dissipation of trapped charges. The material and electrical properties of the Al2O3/ZnO ALD films were investigated using Auger electron spectroscopy (AES), nanoindentation, and mercury probe measurements. Chemical analysis using AES confirmed the presence of both Al and Zn in the alloys. The nanoindentation measurements were used to calculate the Young's modulus and hardness of the films. Pure Al2O3 ALD was determined to have a modulus between 150 and 155 GPa and a hardness of ~8 GPa, while the results for pure ZnO ALD indicated a modulus between 120 and 140 GPa and a hardness of ~5 GPa. An Al2O3/ZnO ALD alloy displayed a modulus of 140-145 GPa, which falls between the two pure films, and a hardness of ~8 GPa, which is similar to the pure Al2O3 film. The dielectric constants of the ALD films were calculated from the mercury probe measurements and were determined to be around 6.8. These properties indicate that the Al2O3/ZnO ALD films can be engineered as a property specific dielectric layer for RF MEMS devices.

  3. Highly transparent and reproducible nanocrystalline ZnO and AZO thin films grown by room temperature pulsed-laser deposition on flexible Zeonor plastic substrates

    NASA Astrophysics Data System (ADS)

    Inguva, Saikumar; Vijayaraghavan, Rajani K.; McGlynn, Enda; Mosnier, Jean-Paul

    2015-09-01

    Zeonor plastics are highly versatile due to exceptional optical and mechanical properties which make them the choice material in many novel applications. For potential use in flexible transparent optoelectronic applications, we have investigated Zeonor plastics as flexible substrates for the deposition of highly transparent ZnO and AZO thin films. Films were prepared by pulsed laser deposition at room temperature in oxygen ambient pressures of 75, 150 and 300 mTorr. The growth rate, surface morphology, hydrophobicity and the structural, optical and electrical properties of as-grown films with thicknesses ˜65-420 nm were recorded for the three oxygen pressures. The growth rates were found to be highly linear both as a function of film thickness and oxygen pressure, indicating high reproducibility. All the films were optically smooth, hydrophobic and nanostructured with lateral grain shapes of ˜150 nm wide. This was found compatible with the deposition of condensed nanoclusters, formed in the ablation plume, on a cold and amorphous substrate. Films were nanocrystalline (wurtzite structure), c-axis oriented, with average crystallite size ˜22 nm for ZnO and ˜16 nm for AZO. In-plane compressive stress values of 2-3 GPa for ZnO films and 0.5 GPa for AZO films were found. Films also displayed high transmission greater than 95% in some cases, in the 400-800 nm wavelength range. The low temperature photoluminescence spectra of all the ZnO and AZO films showed intense near band edge emission. A considerable spread from semi-insulating to n-type conductive was observed for the films, with resistivity ˜103 Ω cm and Hall mobility in 4-14 cm2 V-1 s-1 range, showing marked dependences on film thickness and oxygen pressure. Applications in the fields of microfluidic devices and flexible electronics for these ZnO and AZO films are suggested.

  4. UV Sensing Properties of ZnO Nanowires Grown on Glass by Rapid Thermal Oxidation of Zinc Films

    NASA Astrophysics Data System (ADS)

    Mihailova, I.; Gerbreders, V.; Sļedevskis, Ē.; Bulanovs, A.; Paškevičs, V.

    2014-08-01

    The nanostructured ZnO thin films were successfully synthesized by rapid thermal oxidation of metallic zinc films without catalysts or additives. On the surface of thin films the formation of ZnO nanowires was observed. In the work, the optical and electrical parameters and photoresponses of the obtained ZnO thin films were investigated. Nanostructured thin films of the type have a promising potential for the use in optoelectronics, sensor technique and biomedical sciences Šī darba galvenais mērķis bija izpētīt UV fotodetektora izgatavošanas iespējamību uz nanostrukturētu ZnO plāno kārtiņu bāzes, kas sintezētas termiski oksidējot Zn plānās kārtiņas. Termiskās oksidēšanas rezultātā tika novērota adatveidīgu ZnO nanostruktūru formēšanās uz kārtiņu virsmas. Izpētītas iegūto paraugu optiskās un elektriskās īpašības, kā arī fotoreakcija. Tika konstatēts, ka iegūto nanostrukturēto ZnO kārtiņu elektriskā vadītspēja ir ārkārtīgi jutīga pret UV starojumu, taču, apstarojot ar redzamo gaismu, strāva paliek gandrīz nemainīga. Kārtiņu elektriskās vadītspējas fotoreakcija ir atkarīga arī no nanostruktūru daudzuma uz virsmas. Visaugstākā UV fotovadītspēja tika novērota paraugam ar vislielāko ZnO nanoadatu koncentrāciju. UV gaismas inducētais vadītspējas pieaugums ļauj ZnO nanoadatas reversīvi pārslēgt starp stāvokļiem "ieslēgts" un "izslēgts". Līdz ar to, šīs fotojutīgās nanoadatas var tikt izmantotas UV gaismas detektoros un optiskajos slēdžos. Šādas nanostrukturētas plānās kārtiņas var tikt pielietotas arī ķīmiskajos un bioloģiskajos sensoros, pjezoelektriskajās ierīcēs, saules elementos utt. Turklāt, šādu nanostrukturēto ZnO plāno kārtiņu sintēzes process ir salīdzinoši lēts un vienkāršs, dodot iespēju liela mēroga produkcijas ražošanai

  5. Electrochemical Synthesis of ZnO Nanorods/Nanotubes/Nanopencils on Transparent Aluminium-Doped Zinc Oxide Thin Films for Photocatalytic Applications.

    PubMed

    Le, Thi Ngoc Tu; Pham, Tan Thi; Ngo, Quang Minh; Vu, Thi Hanh Thu

    2015-09-01

    We report an electrochemical synthesis of homogeneous and well-aligned ZnO nanorods (NRs) on transparent conducting aluminium-doped zinc oxide (AZO) thin films as electrodes. The selected ZnO NRs was then chemically corroded in HCl and KCl aqueous solutions to form nanopencils (NPs), and nanotubes (NTs), respectively. A DC magnetron sputtering was employed to fabricate AZO thin films at various thicknesses. The obtained AZO thin films have a c-direction orientation, transmittance above 80% in visible region, and sheet resistance approximately 40 Ω/sq. They are considered to be relevant as electrodes and seeding layers for electrochemical. The ZnO NRs are directly grown on the AZOs without a need of catalysts or additional seeding layers at temperature as low as 85 degrees C. Their shapes are strongly associated with the AZO thickness that provides a valuable way to control the diameter of ZnO NRs grown atop. With the addition of HCI and KCl aqueous solutions, ZnO NRs were modified their shape to NPs and NTs with the reaction time, respectively. All the ZnO NRs, NPs, and NTs are preferred to grow along c-direction that indicates a lattice matching between AZO thin films and ZnO nanostructrures. Photoluminescence spectra and XRD patterns show that they have good crystallinities. A great photocatalytic activity of ZnO nanostructures promises potential application in environmental treatment and protection. The ZnO NTs exhibits a higher photocatalysis than others possibly due to the oxygen vacancies on the surface and the polarizability of Zn2+ and O2-.

  6. Probing Thin Film Thermophysical Properties Using the Femtosecond Transient ThermoReflectance Technique

    DTIC Science & Technology

    2007-11-02

    Glass Transparent conducting oxide ( SnO2 ) ≈ 600 nm thick Boron doped (p-type) a-Si ≈ 10 nm thick Intrinsic layer (undoped ) a-Si ≈ 200 nm thick...Phospho rus doped (n-type) a-Si ≈ 20 nm thick Rear contact ( ZnO ) ≈ 100 nm thick Light -1.2 -1 -0.8 -0.6 -0.4 -0.2 0 0.2 -1 0 1 2 3 4 5 6 Time (ps) 1.426 eV

  7. Degradation of transparent conductive properties of undoped ZnO and Ga-doped ZnO films left in atmospheric ambient for several years and trials to recover initial conductance

    SciTech Connect

    Akazawa, Housei

    2014-03-15

    This study evaluated the long-term stability of the transparent conductive properties of undoped ZnO and Ga-doped ZnO (GZO) films that had been left in an atmospheric ambient environment for 5 to 6 yr. When ZnO films are stored in a clean room with a controlled temperature and humidity of 23 °C and 45%, respectively, throughout the year, the increases in sheet resistance are less than 5% of their initial value. The ZnO films stored in a non-air-conditioned laboratory room, whose temperature varies between 5 and 35 °C and humidity varies between 30% and 70% per year, suffer from increases in the sheet resistance by almost 13%, which is associated with a slight rise in the near-infrared transmittance level. Postannealing of these degraded ZnO films at 150–200 °C recovers the initial conductance by removing the H{sub 2}O molecules that have penetrated the film. One hour of irradiation with electron cyclotron resonance Ar plasma effectively restores the conductive surfaces while maintaining a temperature below 70 °C. The GZO films containing a few weight percent of Ga{sub 2}O{sub 3} are stable even when stored in a non-air-conditioned laboratory room, with changes in the sheet resistance of less than 3%. The GZO films with a Ga{sub 2}O{sub 3} content larger than 10 wt. %, however, exhibit serious degradation probably due to the strong affinity of segregated Ga{sub 2}O{sub 3} domains with H{sub 2}O vapor molecules. Neither postannealing nor Ar plasma irradiation can recover the initial sheet resistance of these GZO films.

  8. Manipulated transformation of filamentary and homogeneous resistive switching on ZnO thin film memristor with controllable multistate.

    PubMed

    Huang, Chi-Hsin; Huang, Jian-Shiou; Lai, Chih-Chung; Huang, Hsin-Wei; Lin, Su-Jien; Chueh, Yu-Lun

    2013-07-10

    A bias polarity-manipulated transformation from filamentary to homogeneous resistive switching was demonstrated on a Pt/ZnO thin film/Pt device. Two types of switching behaviors, exhibiting different resistive switching characteristics and memory performances were investigated in detail. The detailed transformation mechanisms are systematically proposed. By controlling different compliance currents and RESET-stop voltages, controllable multistate resistances in low resistance states and a high resistance states in the ZnO thin film metal-insulator-metal structure under the homogeneous resistive switching were demonstrated. We believe that findings would open up opportunities to explore the resistive switching mechanisms and performance memristor with multistate storage.

  9. Enhancement of photo sensor properties of nanocrystalline ZnO thin film by swift heavy ion irradiation

    SciTech Connect

    Mahajan, S. V.; Upadhye, D. S.; Bagul, S. B.; Shaikh, S. U.; Birajadar, R. B.; Siddiqui, F. Y.; Huse, N. P.; Sharma, R. B. E-mail: rps.phy@gmail.com

    2015-06-24

    Nanocrystalline Zinc Oxide (ZnO) thin film prepared by Low cost Successive Ionic Layer Adsorption and Reaction (SILAR) method. This film was irradiated by 120 MeV Ni{sup 7+} ions with the fluence of 5x10{sup 12}ions/cm{sup 2}. The X-ray diffraction study was shows polycrystalline nature with wurtzite structure. The optical properties as absorbance were determined using UV-Spectrophotometer and band gap was also calculated. The Photo Sensor nature was calculated by I-V characteristics with different sources of light 40W, 60W and 100W.

  10. Origins of shallow level and hole mobility in codoped p-type ZnO thin films

    NASA Astrophysics Data System (ADS)

    Ye, H. B.; Kong, J. F.; Shen, W. Z.; Zhao, J. L.; Li, X. M.

    2007-03-01

    A combination study of structural, optical, and electrical properties has been carried out on N-In codoped p-type ZnO thin films for the origins of shallow level and hole mobility. The observed small activation energy of ˜20meV for the hole concentration corresponds well to the results from photoluminescence and conductivity data, revealing the grain boundary trapping nature of the shallow level. The achieved hole mobility is mainly due to the lack of grain boundary barrier effect, and the codoping yielded weak ionized impurity scattering. The authors have also revealed the scattering and conduction mechanisms in these p-ZnO films.

  11. Photoluminescence and electrochemical properties of transparent CeO2-ZnO nanocomposite thin films prepared by Pechini method

    NASA Astrophysics Data System (ADS)

    Sani, Z. Khosousi; Ghodsi, F. E.; Mazloom, J.

    2017-02-01

    Nanocomposite thin films of CeO2-ZnO with different molar ratios of Zn/Ce (=0, 0.25, 0.5, 0.75 and 1) were prepared by the Pechini sol-gel route. Various spectroscopic and electrochemical techniques were applied to investigate the films. XRD patterns of all the samples exhibited the peaks corresponding to cubic fluorite structure of ceria and the (101) and (103) peaks of ZnO with hexagonal structure was just observed in the sample with molar ratio of 1. EDS confirmed the presence of constituent of element in the samples. FESEM images of the films showed a surface composed of nanograins. AFM analysis revealed that root mean square roughness was enhanced as molar ratio of Zn/Ce increased. Moreover, fractal dimension of surfaces were calculated by cube counting approach. Optical measurements indicated that the film with molar ratio of 1 has the highest transmission and lowest reflectivity. The optical band gap values varied between 2.95 and 3.42 eV. The compositional dependence of refractive index and extinction coefficient were reported. The UV and blue emission appeared in PL spectra. The highest photoluminescence emission intensity was observed in the 1:1 molar ratio sample. The cyclic voltammetry measurements indicated the highest charge density (9.75 mC cm-2) and diffusion coefficient (3.507 × 10-17 cm2 s-1) belonged to the Ce/Zn (1:1) thin film.

  12. Sn-doped ZnO nanocrystalline thin films with enhanced linear and nonlinear optical properties for optoelectronic applications

    NASA Astrophysics Data System (ADS)

    Ganesh, V.; Yahia, I. S.; AlFaify, S.; Shkir, Mohd.

    2017-01-01

    In the current work, nanocrystalline undoped and Sn doped ZnO thin films with different doping concentrations (1, 3, 5, 7 at%) have been deposited on glass substrate by low cost spin coating technique. The strong effect of Sn doping on structural, morphological, optical, nonlinear properties have been observed. X-ray diffraction study revealed that all the thin films are preferentially grown along (002) plane. The crystallite size is found to be increased with increasing the concentration of Sn, similar behavior was observed by atomic force microscopy analysis. Optical study shows that the prepared thin films are highly transparent. The direct optical band gap was calculate and found to be 3.16, 3.20, 3.22, 3.34, 3.18 eV for pure and doped films respectively. The refractive index, linear susceptibility, nonlinear absorption coefficient, nonlinear susceptibility and nonlinear refractive index were calculated. Furthermore, the third order nonlinear optical properties are investigated using Z-scan technique and their values are found to be -3.75×10-8 cm2/W, -3.76×10-3 cm/W and 0.65×10-3 esu for 7% Sn doped ZnO, respectively. There is a good correlation between theoretical and experimental third order nonlinear properties and higher values shows that the deposited films are may be applied in nonlinear optical applications.

  13. Effects of substrate conductivity on cell morphogenesis and proliferation using tailored, atomic layer deposition-grown ZnO thin films

    PubMed Central

    Choi, Won Jin; Jung, Jongjin; Lee, Sujin; Chung, Yoon Jang; Yang, Cheol-Soo; Lee, Young Kuk; Lee, You-Seop; Park, Joung Kyu; Ko, Hyuk Wan; Lee, Jeong-O

    2015-01-01

    We demonstrate that ZnO films grown by atomic layer deposition (ALD) can be employed as a substrate to explore the effects of electrical conductivity on cell adhesion, proliferation, and morphogenesis. ZnO substrates with precisely tunable electrical conductivity were fabricated on glass substrates using ALD deposition. The electrical conductivity of the film increased linearly with increasing duration of the ZnO deposition cycle (thickness), whereas other physical characteristics, such as surface energy and roughness, tended to saturate at a certain value. Differences in conductivity dramatically affected the behavior of SF295 glioblastoma cells grown on ZnO films, with high conductivity (thick) ZnO films causing growth arrest and producing SF295 cell morphologies distinct from those cultured on insulating substrates. Based on simple electrostatic calculations, we propose that cells grown on highly conductive substrates may strongly adhere to the substrate without focal-adhesion complex formation, owing to the enhanced electrostatic interaction between cells and the substrate. Thus, the inactivation of focal adhesions leads to cell proliferation arrest. Taken together, the work presented here confirms that substrates with high conductivity disturb the cell-substrate interaction, producing cascading effects on cellular morphogenesis and disrupting proliferation, and suggests that ALD-grown ZnO offers a single-variable method for uniquely tailoring conductivity. PMID:25897486

  14. Competition between (001) and (111) MgO thin film growth on Al-doped ZnO by oxygen plasma assisted pulsed laser deposition

    SciTech Connect

    Xiao, Bo; Yang, Qiguang; Walker, Brandon; Gonder, Casey A.; Romain, Gari C.; Mundle, Rajeh; Bahoura, Messaoud; Pradhan, A. K.

    2013-06-07

    We report on the study of epitaxial MgO thin films on (0001) Al-doped ZnO (Al: ZnO) underlayers, grown by oxygen plasma assisted pulsed laser deposition technique. A systematic investigation of the MgO thin films was performed by X-ray diffraction and atomic force microscopy, along with the current-voltage characteristics. A distinguished behavior was observed that the preferred MgO orientation changes from (111) to (001) in the films as the growth temperature increases. Two completely different in-plane epitaxial relationships were also determined from X-ray diffraction as: [110]MgO//[1120]Al: ZnO and [110]MgO//[1100]Al: ZnO for (001) MgO with 60 Degree-Sign rotated triplet domains, and [110]MgO//[1120]Al: ZnO for (111) MgO with 180 Degree-Sign rotated twin. The pronounced temperature dependence indicates a reconciliation of the nucleation driving forces among surface, interfacial, and strain energy for heteroepitaxy of cubic MgO on hexagonal Al: ZnO. The related interfacial atomic registry is considered to be important to the formation of unusual (001) MgO on hexagonal crystals. In addition, the electrical characterization revealed a dramatic reduction of the leakage current in (001) MgO thin films, whereas the small grain size of (111) MgO is identified by atomic force microscopy as a main cause of large leakage current.

  15. Effect of Rapid Thermal Annealing on the Electrical Characteristics of ZnO Thin-Film Transistors

    NASA Astrophysics Data System (ADS)

    Remashan, Kariyadan; Hwang, Dae-Kue; Park, Seong-Ju; Jang, Jae-Hyung

    2008-04-01

    Thin-film transistors (TFTs) with a bottom-gate configuration were fabricated with an RF magnetron sputtered undoped zinc oxide (ZnO) channel layer and plasma-enhanced chemical vapor deposition (PECVD) grown silicon nitride as a gate dielectric. Postfabrication rapid thermal annealing (RTA) and subsequent nitrous oxide (N2O) plasma treatment were employed to improve the performance of ZnO TFTs in terms of on-current and on/off current ratio. The RTA treatment increases the on-current of the TFT significantly, but it also increases its off-current. The off-current of 2×10-8 A and on/off current ratio of 3×103 obtained after the RTA treatment were improved to 10-10 A and 105, respectively, by the subsequent N2O plasma treatment. The better device performance can be attributed to the reduction of oxygen vacancies at the top region of the channel due to oxygen incorporation from the N2O plasma. X-ray photoelectron spectroscopy (XPS) analysis of the TFT samples showed that the RTA-treated ZnO surface has more oxygen vacancies than as-deposited samples, which results in the increased drain current. The XPS study also showed that the subsequent N2O plasma treatment reduces oxygen vacancies only at the surface of ZnO so that the better off-current and on/off current ratio can be obtained.

  16. Gate insulator effects on the electrical performance of ZnO thin film transistor on a polyethersulphone substrate.

    PubMed

    Lee, Jae-Kyu; Choi, Duck-Kyun

    2012-07-01

    Low temperature processing for fabrication of transistor backplane is a cost effective solution while fabrication on a flexible substrate offers a new opportunity in display business. Combination of both merits is evaluated in this investigation. In this study, the ZnO thin film transistor on a flexible Polyethersulphone (PES) substrate is fabricated using RF magnetron sputtering. Since the selection and design of compatible gate insulator is another important issue to improve the electrical properties of ZnO TFT, we have evaluated three gate insulator candidates; SiO2, SiNx and SiO2/SiNx. The SiO2 passivation on both sides of PES substrate prior to the deposition of ZnO layer was effective to enhance the mechanical and thermal stability. Among the fabricated devices, ZnO TFT employing SiNx/SiO2 stacked gate exhibited the best performance. The device parameters of interest are extracted and the on/off current ratio, field effect mobility, threshold voltage and subthreshold swing are 10(7), 22 cm2/Vs, 1.7 V and 0.4 V/decade, respectively.

  17. Effect of reduced graphene oxide-hybridized ZnO thin films on the photoinactivation of Staphylococcus aureus and Salmonella enterica serovar Typhi.

    PubMed

    Teh, Swe Jyan; Yeoh, Soo Ling; Lee, Kian Mun; Lai, Chin Wei; Abdul Hamid, Sharifah Bee; Thong, Kwai Lin

    2016-08-01

    The immobilization of photocatalyst nanoparticles on a solid substrate is an important aspect for improved post-treatment separation and photocatalyst reactor design. In this study, we report the simple preparation of reduced graphene oxide (rGO)-hybridized zinc oxide (ZnO) thin films using a one-step electrochemical deposition, and investigated the effect of rGO-hybridization on the photoinactivation efficiency of ZnO thin films towards Staphylococcus aureus (S. aureus) and Salmonella enterica serovar Typhi (S. Typhi) as target bacterial pathogens. Field-emission scanning electron microscopy (FESEM) revealed the formation of geometric, hexagonal flakes of ZnO on the ITO glass substrate, as well as the incorporation of rGO with ZnO in the rGO/ZnO thin film. Raman spectroscopy indicated the successful incorporation of rGO with ZnO during the electrodeposition process. Photoluminescence (PL) spectroscopy indicates that rGO hybridization with ZnO increases the amount of oxygen vacancies, evidenced by the shift of visible PL peak at 650 to 500nm. The photoinactivation experiments showed that the thin films were able to reduce the bacterial cell density of Staph. aureus and S. Typhi from an initial concentration of approximately 10(8) to 10(3)CFU/mL within 15min. The rGO/ZnO thin film increased the photoinactivation rate for S. aureus (log[N/No]) from -5.1 (ZnO) to -5.9. In contrast, the application of rGO/ZnO thin film towards the photoinactivation of S. Typhi did not improve its photoinactivation rate, compared to the ZnO thin film. We may summarise that (1) rGO/ZnO was effective to accelerate the photoinactivation of S. aureus but showed no difference to improve the photoinactivation of S. Typhi, in comparison to the performance of ZnO thin films, and (2) the photoinactivation in the presence of ZnO and rGO/ZnO was by ROS damage to the extracellular wall.

  18. Enhanced mechanism investigation on violet-blue emission of ZnO films by incorporating Al and Zn to form ZnO-Al-Zn films

    NASA Astrophysics Data System (ADS)

    Chen, Haixia; Ding, Jijun; Wang, Xiaomeng; Wang, Xiaojun; Chen, Guoxiang; Ma, Li

    2016-12-01

    ZnO, ZnO-Zn, ZnO-Al0.10-Zn and ZnO-Al0.15-Zn are deposited on glass substrates by radio frequency and direct current magnetron co-sputtering. Photoluminescence (PL) measurements show that the optical performances of samples are strongly dependent on both Al and Zn incoprations. The origin of the defect-related PL emission has been investigated for a long time. Several different hypotheses have been proposed, however, they are still under investigation. Especially for the blue emissions, its origins have been debated intensely for more than thirty years because of its sparsity and instability. In this paper, both violet and blue emissions are observed in all the samples. PL emission decreases sharply as Zn is doped in ZnO to form ZnO-Zn film. However, as both Al and Zn are simultaneously doped in ZnO to form ZnO-Al0.10-Zn film, PL emission conversely increases and attains the maxima. In addition, PL emission decreases again with the increase of Al target power to form ZnO-Al0.15-Zn film. We concluded that violet-blue emission is ascribed to defect types in reverse change trend with interstitial Zn, such as Zn vacancies. This is different from previous universal hypothesis that violet-blue emission is from interstitial Zn defects.

  19. Sol-gel derived Al and Ga co-doped ZnO thin films: An optoelectronic study

    NASA Astrophysics Data System (ADS)

    Ebrahimifard, Reza; Golobostanfard, Mohammad Reza; Abdizadeh, Hossein

    2014-01-01

    Al and Ga co-doped ZnO (AGZO) thin films with different doping contents of 0.5-4 at.% were synthesized via sol-gel route using dip coating method and the results were compared to the single doped specimens Al:ZnO (AZO) and Ga:ZnO (GZO). All samples were highly transparent in visible region (T > 85%) with band gap values around 3.3 eV. Introduction of Al and Ga to the ZnO crystal structure decreased the crystallinity and reduced the particle size of the films. Electrical resistivity was investigated and engineered in this study as the main parameter. Single doped samples showed reduction of resistivity compared to the un-doped ZnO. In this regard, Ga was more efficient than Al in decreasing the electrical resistivity. Furthermore, samples with 1 at.% Al and 1 at.% Ga showed the minimum amount of electrical resistivity. Co-doping was performed with two different approaches including variable doping content (Al + Ga ≠ cte) and constant doping content (Al + Ga = 0.5, 1, and 2 at.%) for the sake of the comparison with single doped samples. Samples with Al = 1 at.% and Ga = 1 at.% showed the lowest electrical resistivity in AGZO samples of former approach. However, in latter approach the lowest resistivity was obtained in Al + Ga = 2 at.% sample. The results proved the capability of co-doped samples in optoelectronic industry regarding partially substitution of expensive Ga with Al and obtaining co-doped AGZO transparent conductive thin films with lower resistivity compared to conventional AZO thin films and also achieving commercial advantages compared to costly GZO thin films.

  20. Galvanic deposition of nanocrystalline ZnO thin films from a ZnO-Zn(OH)(2) mixed phase precursor on p-Si substrate.

    PubMed

    Mukherjee, N; Bhattacharyya, P; Banerjee, M; Mondal, A; Gettens, Robert T T; Ghosh, P K; Saha, H

    2006-05-28

    A galvanic technique for the deposition of ZnO thin films is reported. The depositions were carried out on p-type single-crystal silicon substrates at room temperature, from a solution of ZnSO(4), where the Zn rod acted as a sacrificing anode and p-Si was the cathode. The deposition of ZnO by this method is pH sensitive, and a pH between 4 and 5 is found to be optimum for film deposition. This deposition technique is simple, inexpensive and can be carried out at room temperature. X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM) studies revealed the nanocrystalline structure of the films. The resistivity of the annealed ZnO films was determined by the Van der Pauw measurement technique.

  1. Characteristics of Al-doped ZnO films grown by atomic layer deposition for silicon nanowire photovoltaic device.

    PubMed

    Oh, Byeong-Yun; Han, Jin-Woo; Seo, Dae-Shik; Kim, Kwang-Young; Baek, Seong-Ho; Jang, Hwan Soo; Kim, Jae Hyun

    2012-07-01

    We report the structural, electrical, and optical characteristics of Al-doped ZnO (ZnO:Al) films deposited on glass by atomic layer deposition (ALD) with various Al2O3 film contents for use as transparent electrodes. Unlike films fabricated by a sputtering method, the diffraction peak position of the films deposited by ALD progressively moved to a higher angle with increasing Al2O3 film content. This indicates that Zn sites were effectively replaced by Al, due to layer-by-layer growth mechanism of ALD process which is based on alternate self-limiting surface chemical reactions. By adjusting the Al2O3 film content, a ZnO:Al film with low electrical resistivity (9.84 x 10(-4) Omega cm) was obtained at an Al2O3 film content of 3.17%, where the Al concentration, carrier mobility, optical transmittance, and bandgap energy were 2.8 wt%, 11.20 cm2 V(-1) s(-1), 94.23%, and 3.6 eV, respectively. Moreover, the estimated figure of merit value of our best sample was 8.2 m7Omega(-1). These results suggest that ZnO:Al films deposited by ALD could be useful for electronic devices in which especially require 3-dimensional conformal deposition of the transparent electrode and surface passivation.

  2. Low-temperature growth and physical investigations of undoped and (In, Co) doped ZnO thin films sprayed on PEI flexible substrate

    NASA Astrophysics Data System (ADS)

    Ben Ameur, S.; Barhoumi, A.; Mimouni, R.; Amlouk, M.; Guermazi, H.

    2015-08-01

    ZnO thin films were deposited on polymer substrate Polyethyerimide (PEI) at 250 °C by spray pyrolysis technique. The effects of different doping elements (Co and In) on physical properties of ZnO thin films were investigated. Thin film characterizations were carried out using X-ray diffraction technique, UV-Vis-NIR spectroscopy, Photoluminescence (PL) spectroscopy and the contact angle measurement method. XRD measurement showed a successful growth of crystalline films on polymer substrate at low temperature by the spray pyrolysis process. XRD patterns revealed that all films consist of single ZnO phase and were well crystallized with preferential orientation towards (1 0 1) direction. Doping by cobalt has effective role in the enhancement of the crystalline quality, increases in the band gap according to Burstein Moss effect. Doping with indium leads rather to the decrease of both crystallinity and optical band gap energy value. Photoluminescence of the films showed UV emission (NBE) and visible emission related to defects. The contact angles were measured to study the effect of various doping elements on the hydrophobicity of the film depending on surface roughness. Results showed strong dependence on the doping element. In fact, doping with cobalt element increases the roughness of ZnO films and reinforces the surface from hydrophilic to hydrophobic (θ > 90°).

  3. Photoelectrochemical water oxidation by screen printed ZnO nanoparticle films: effect of pH on catalytic activity and stability

    NASA Astrophysics Data System (ADS)

    Fekete, Monika; Riedel, Wiebke; Patti, Antonio F.; Spiccia, Leone

    2014-06-01

    Nanostructured ZnO films are promising photoanode materials in photoelectrochemical water splitting. While such ZnO photoanodes have achieved high activity and good light conversion efficiency in the UV spectral region, their application in water splitting devices has been hampered by the susceptibility of ZnO towards photocorrosion in aqueous electrolytes. We report a systematic investigation aimed at optimising the electrolyte solution to improve the long-term stability of ZnO photoanodes. A stability diagram, based on the band edge positions of ZnO and the pH-dependent photodegradation potentials of ZnO (relative to the decomposition of water), indicates that the optimum pH operating conditions for ZnO photoanodes lie between pH 9-12.5. To verify this prediction experimentally, the activity and long-term stability of uniform screen-printed nano-ZnO films was tested in a wide range of buffered and non-buffered electrolytes (pH 6-13.5). The ZnO films were more active in buffered, than in non-buffered electrolytes, and the highest activities were observed close to the pKa of the phosphate and borate buffers used. Under zero applied potential, these screen-printed films achieved the highest reported photocurrents to date (0.42 mA cm-2 at pH 6 and 0.67 mA cm-2 at pH 10.5) for any pristine or modified ZnO-based water oxidation catalyst. The films were subjected to 12 h of controlled potential electrolysis, in selected electrolytes, under AM 1.5G simulated sunlight. The results are in good agreement with calculations based on thermodynamic data for ZnO. Films tested at pH 6 and 7 (representing typically used operating conditions) degraded rapidly, whereas they exhibited the highest stability when tested in a pH 10.5 borate buffer. In this case, 75% of the initial photoactivity was preserved after 12 hours, indicating that the lifetime of the electrode could be increased by over an order of magnitude compared to standard testing conditions.Nanostructured ZnO films are

  4. Development of silane grafted ZnO core shell nanoparticles loaded diglycidyl epoxy nanocomposites film for antimicrobial applications.

    PubMed

    Suresh, S; Saravanan, P; Jayamoorthy, K; Ananda Kumar, S; Karthikeyan, S

    2016-07-01

    In this article a series of epoxy nanocomposites film were developed using amine functionalized (ZnO-APTES) core shell nanoparticles as the dispersed phase and a commercially available epoxy resin as the matrix phase. The functional group of the samples was characterized using FT-IR spectra. The most prominent peaks of epoxy resin were found in bare epoxy and in all the functionalized ZnO dispersed epoxy nanocomposites (ZnO-APTES-DGEBA). The XRD analysis of all the samples exhibits considerable shift in 2θ, intensity and d-spacing values but the best and optimum concentration is found to be 3% ZnO-APTES core shell nanoparticles loaded epoxy nanocomposites supported by FT-IR results. From TGA measurements, 100wt% residue is obtained in bare ZnO nanoparticles whereas in ZnO core shell nanoparticles grafted DGEBA residue percentages are 37, 41, 45, 46 and 52% for 0, 1, 3, 5 and 7% ZnO-APTES-DGEBA respectively, which is confirmed with ICP-OES analysis. From antimicrobial activity test, it was notable that antimicrobial activity of 7% ZnO-APTES core shell nanoparticles loaded epoxy nanocomposite film has best inhibition zone effect against all pathogens under study.

  5. Spectral reflectance and transmission modeling of multi-cavity Fabry-Pérot interferometer with ZnO thin films

    NASA Astrophysics Data System (ADS)

    Hirsch, Marzena; Szreder, Agnieszka

    2016-09-01

    In this paper spectral reflectance and transmission of a low-coherence fiber-optic Fabry-Pérot interferometer with thin ZnO layers is analyzed using a multi-cavity approach. In the investigated setup two standard single-mode optical fibers (SMF-28) with thin ZnO films deposited on their end-faces form an extrinsic Fabry-Pérot interferometer with air cavity. Calculations of the spectral response of the interferometer were performed for different thickness of the layers (50, 100, 150, 200 nm). Based on the obtained results, it can be concluded that the use of ZnO thin films improves the reflectance of the interferometer. Moreover, addition of another cavity can make it possible to perform sensing of two different quantities (e.g. temperature and refractive index). The optimal lengths of the Fabry-Pérot cavities were selected using the results of modelling for achieving the best performance in a sensing application.

  6. Structural, electrical, and optical properties of Ti-doped ZnO films fabricated by atomic layer deposition

    PubMed Central

    2013-01-01

    High-quality Ti-doped ZnO films were grown on Si, thermally grown SiO2, and quartz substrates by atomic layer deposition (ALD) at 200°C with various Ti doping concentrations. Titanium isopropoxide, diethyl zinc, and deionized water were sources for Ti, Zn, and O, respectively. The Ti doping was then achieved by growing ZnO and TiO2 alternately. A hampered growth mode of ZnO on TiO2 layer was confirmed by comparing the thicknesses measured by spectroscopic ellipsometry with the expected. It was also found that the locations of the (100) diffraction peaks shift towards lower diffraction angles as Ti concentration increased. For all samples, optical transmittance over 80% was obtained in the visible region. The sample with ALD cycle ratio of ZnO/TiO2 being 20 had the lowest resistivity of 8.874 × 10−4 Ω cm. In addition, carrier concentration of the prepared films underwent an evident increase and then decreased with the increase of Ti doping concentration. PMID:23442766

  7. RETRACTED: Investigation of structural, optical and electronic properties in Al-Sn co-doped ZnO thin films

    NASA Astrophysics Data System (ADS)

    Pan, Zhanchang; Tian, Xinlong; Wu, Shoukun; Yu, Xia; Li, Zhuliang; Deng, Jianfeng; Xiao, Chumin; Hu, Guanghui; Wei, Zhigang

    2013-01-01

    This article has been retracted: please see Elsevier Policy on Article Withdrawal (http://www.elsevier.com/locate/withdrawalpolicy). This article has been retracted at the request of the Editor-in-Chief. Figures 3 and 4 of this paper have also been presented as belonging to other materials in other publications. This observation is evidence of fraud and therefore it is not certain that the described research and conclusions of this paper belong to the presented images. Figures 3 and 4 of this paper can also be found in: Effect of annealing on the structures and properties of Al and F co-doped ZnO nanostructures, Materials Science in Semiconductor Processing, 2014, 17, 162-167, http://dx.doi.org/10.1016/j.mssp.2013.09.023 Highly transparent and conductive Sn/F and Al co-doped ZnO thin films prepared by sol-gel method, Journal of Alloys and Compounds, 2014,583, 32-38, http://dx.doi.org/10.1016/j.jallcom.2013.06.192 Properties of fluorine and tin co-doped ZnO thin films deposited by sol-gel method, Journal of Alloys and Compounds, 2013,576, 31-37, http://dx.doi.org/10.1016/j.jallcom.2013.04.132

  8. Simulation, fabrication and characterization of ZnO based thin film transistors grown by radio frequency magnetron sputtering.

    PubMed

    Singh, Shaivalini; Chakrabarti, P

    2012-03-01

    We report the performance of the thin film transistors (TFTs) using ZnO as an active channel layer grown by radio frequency (RF) magnetron sputtering technique. The bottom gate type TFT, consists of a conventional thermally grown SiO2 as gate insulator onto p-type Si substrates. The X-ray diffraction patterns reveal that the ZnO films are preferentially orientated in the (002) plane, with the c-axis perpendicular to the substrate. A typical ZnO TFT fabricated by this method exhibits saturation field effect mobility of about 0.6134 cm2/V s, an on to off ratio of 102, an off current of 2.0 x 10(-7) A, and a threshold voltage of 3.1 V at room temperature. Simulation of this TFT is also carried out by using the commercial software modeling tool ATLAS from Silvaco-International. The simulated global characteristics of the device were compared and contrasted with those measured experimentally. The experimental results are in fairly good agreement with those obtained from simulation.

  9. Inverter Circuits Using ZnO Nanoparticle Based Thin-Film Transistors for Flexible Electronic Applications

    PubMed Central

    Vidor, Fábio F.; Meyers, Thorsten; Hilleringmann, Ulrich

    2016-01-01

    Innovative systems exploring the flexibility and the transparency of modern semiconducting materials are being widely researched by the scientific community and by several companies. For a low-cost production and large surface area applications, thin-film transistors (TFTs) are the key elements driving the system currents. In order to maintain a cost efficient integration process, solution based materials are used as they show an outstanding tradeoff between cost and system complexity. In this paper, we discuss the integration process of ZnO nanoparticle TFTs using a high-k resin as gate dielectric. The performance in dependence on the transistor structure has been investigated, and inverted staggered setups depict an improved performance over the coplanar device increasing both the field-effect mobility and the ION/IOFF ratio. Aiming at the evaluation of the TFT characteristics for digital circuit applications, inverter circuits using a load TFT in the pull-up network and an active TFT in the pull-down network were integrated. The inverters show reasonable switching characteristics and V/V gains. Conjointly, the influence of the geometry ratio and the supply voltage on the devices have been analyzed. Moreover, as all integration steps are suitable to polymeric templates, the fabrication process is fully compatible to flexible substrates. PMID:28335282

  10. The performances photodiode and diode of ZnO thin film by atomic layer deposition technique

    NASA Astrophysics Data System (ADS)

    Orak, İkram

    2016-12-01

    In this study, the photodiode and diode characterizations of Al/n-ZnO/p type Si heterostructure have been investigated with current-voltage (I-V), capacitance-voltage (C-V) and conductance-voltage (G/ω-V) measurements. ZnO thin film has been deposited on p type Si by using atomic layer deposition technique. Some photodiode and diode parameters such as open circuit voltage (Voc), short circuit current (Isc), power efficiency(ηP), fill factor (FF), ideality factor (n) and barrier height (Φb) have calculated with I-V and C-V characteristics. Voc and Isc was found to be 0.094 V and 0.24 mA, respectively at 50 mW/cm2. n and Φb have been calculated 0.41 eV and 2.36, respectively. Especially, Negative capacitance has explained in the forward bias regions at room temperature and in dark condition. The C-V characterization of the Al/ZnO/p type Si heterostructure has been investigated under illumination condition. It can be said that the capacitance of device has been affected under illumination condition.

  11. Structural and Optical properties of Er doped ZnO diluted magnetic semiconductor nano thin films produced by sol gel method

    NASA Astrophysics Data System (ADS)

    Tasci, A. Tolga; Ozturk, Ozgur; Asikuzun, Elif; Arda, Lutfi; Celik, Sukru; Terzioglu, Cabir

    Undoped and Er doped ZnO (Zn1-xErxO) transparent semiconductor thin films were coated using sol-gel method on non-alkali glass. Erbium was doped 1%, 2%, 3%, 4% and 5% ratio. Methanol and monoethanolamine were used as solvent and stabilizer. In this study, the effect of Er doping was examined on the structural and optical properties of ZnO DMS thin films. XRD, SEM and UV-VIS-NIR spectrometer measurements were performed for the structural and optical characterization. XRD results showed that, all of Er doped ZnO thin films have a hexagonal structure. The optical transmittance of rare earth element (Er) doped ZnO thin films were increased. The Er doped ZnO thin films showed high transparency (>84) in the visible region (400-700 nm). This research has been supported by the Kastamonu University Scientific Research Projects Coordination Department under the Grant No. KUBAP-03/2013-41 and the Scientific and Technological Research Council of Turkey (TUBITAK) Project No. 114F259.

  12. Investigation of electrical and optical properties of MEH-PPV: ZnO nanocomposite films for OLED applications

    NASA Astrophysics Data System (ADS)

    Azhar, N. E. A.; Shafura, A. K.; Affendi, I. H. H.; Shariffudin, S. S.; Saurdi, I.; Alrokayan, Salman A. H.; Khan, Haseeb A.; Rusop, M.

    2016-07-01

    Recent investigations of the promising materials for optoelectronic have been demonstrated by introducing n-type inorganic material into conjugated polymer. The optical and electrical of nanocomposite films based on poly[2-methoxy-5-(2'-ethyl-hexyloxy)-1,4-phenylene vinylene] (MEH-PPV) and zinc oxide (ZnO) nanostructured of various deposition layers (1 to 3 layers) have been investigated. The MEH-PPV: ZnO nanocomposite films were deposited using spin-coating technique. The surface morphology nanocomposite films were characterized using field emission scanning electron microscope. From surface profiler measurement, we found that the thickness of nanocomposite films increased as deposition time increased. The optical properties were measured using photoluminescence spectroscope. The photoluminescence (PL) spectra showed that two deposition layers is the highest intensity at visible region (green emission) due to high energy transfer from particles to the polymer. The current density for two layers sample is due to aggregation of conjugated polymer chain hence form excited interchain exciton for optical excitation. This study will provide better performance and suitable for optoelectronic device especially OLEDs application.

  13. Investigation on the Electrical and Methane Gas-Sensing Properties of ZnO Thin Films Produced by Different Methods

    NASA Astrophysics Data System (ADS)

    Teimoori, F.; Khojier, K.; Dehnavi, N. Z.

    2016-10-01

    In this work, the influence of deposition method on the structural, electrical, and methane gas-sensing properties of ZnO thin films is investigated. Sol-gel spin coating, direct current (DC) magnetron sputtering, and e-beam evaporation techniques are employed for production of Zn thin films post-annealed at 500°C with a constant flow of oxygen. Detailed morphological, chemical, and structural investigations are carried out on all samples by field emission electron microscopy (FESEM) and x-ray diffraction (XRD) analyses. DC electrical resistivity of the samples was measured using a four-point probe instrument while a Hall effect instrument was used for the Hall effect measurements. The sensing performance was optimized with respect to the deposition method as well as the operating temperature. Detection limit, reproducibility, and stability of all samples produced using different methods are also identified. An optimum operating temperature of 350°C is obtained. The best sensitivity was attributed to the deposited film by the e-beam evaporation method due to its different surface morphology, which provided a larger ratio of surface-to-bulk area, and a lower carrier concentration, which caused higher electrical resistance. All ZnO thin films deposited by different methods also showed good reproducibility and stability.

  14. Racetrack Effect on the Dissimilar Sensing Response of ZnO Thin Film-An Anisotropy of Isotropy.

    PubMed

    Shankar, Prabakaran; Rayappan, John Bosco Balaguru

    2016-09-21

    The isotropic nature of the sensing elements decides the overall sensing performance of metal oxide gas/chemical sensors. Even a minimum deviation in the morphological and electrical characteristics of the sensing surface will lead to a nonuniform sensing performance, which in turn results in undesired figure of merits. With this background, the inhomogeneity of plasma discharge due to the racetrack effect of the magnetic field orbit in the planar magnetron and its significant influence on the formation of nanostructured ZnO thin films with desired uniformity has been investigated. The effect of the intensity of plasma discharges on the structural studies was a change in crystallite size from 11 to 35 nm. Anisotropic characteristics of the film influenced the mobility of carriers (10 and 220 cm(2) V(-1) s(-1)) by populating the carrier concentration (2.13 × 10(11) and 3.87 × 10(7) cm(-2)) in the nanostructures. Furthermore, the influence of this anisotropic surface of the obtained film on the room-temperature ethanol-sensing behavior is reported. The first observation of the racetrack effect on the sensing gradient of the sputter-deposited ZnO thin film has brought out the challenge in preparing an isotropic sensing element without anisotropy.

  15. Characterization of spray-deposited ZnO thin films for dye-sensitized solar cell application

    NASA Astrophysics Data System (ADS)

    Amala Rani, A.; Ernest, Suhashini

    2016-07-01

    ZnO films have been prepared on glass plates with concentrations of 0.025, 0.05 and 0.1 M each consisting of 50 ml of solution using the spray pyrolysis technique. A dye-sensitized solar cell (DSSC) was constructed by means of the obtained film for 0.1 M which was also coated above the ITO substrate. N-719, iodide and platinum-coated ITO glass plates were used as the dye, electrolyte and counter electrode, respectively. XRD confirms that the structure of the film was polycrystalline having wurtzite structure. The surface with pores was found from the FESEM studies. The DSSC shows an optical transmittance of approximately 70 % in the visible region. The photoluminescence study reveals the electronic structure of the material. The efficiency of the DSSC measured for a 0.1 M ZnO thin film by sensitizing every 2 h was η = 0.51, 0.80, 0.54, 1.12, 2.11, 2.71, 3.15 and 3.20 %, respectively.

  16. Structure, conductivity, and transparency of Ga-doped ZnO thin films arising from thickness contributions

    SciTech Connect

    Liang Shuang; Bi Xiaofang

    2008-12-01

    Ga-doped ZnO (GZO) films were deposited on amorphous glass substrates at room temperature by radio frequency magnetron sputtering. It is revealed that the influence of deposition parameters, such as target-substrate distance and deposition time, on the structure and properties of the films arises primarily from the variations in film thickness. For the GZO films with smaller thicknesses ({<=}385 nm), crystallinity is greatly improved with an increase in thickness, which leads to an increase in Hall mobility and a decrease in electrical resistivity. The carrier concentration is, however, found to exhibit only a slight change with the thickness variations. The relationship of electrical property and microstructure suggests that the resistivity of the films arises mainly from ionic impurity scattering rather than from grain boundary scattering. All the films exhibit a transmittance of over 90% in the visible wavelength range. The band gap of the GZO films is widened with increasing film thickness. In combination with the result that the carrier concentration exhibited a slight dependence on thicknesses, the broadening of the band gap with thicknesses is attributed more to the improved crystallinity than to the Moss-Burstein shift.

  17. Custom-made morphologies of ZnO nanostructured films templated by a poly(styrene-block-ethylene oxide) diblock copolymer obtained by a sol-gel technique.

    PubMed

    Sarkar, Kuhu; Rawolle, Monika; Herzig, Eva M; Wang, Weijia; Buffet, Adeline; Roth, Stephan V; Müller-Buschbaum, Peter

    2013-08-01

    Zinc oxide (ZnO) nanostructured films are synthesized on silicon substrates to form different morphologies that consist of foamlike structures, wormlike aggregates, circular vesicles, and spherical granules. The synthesis involves a sol-gel mechanism coupled with an amphiphilic diblock copolymer poly(styrene-block-ethylene oxide), P(S-b-EO), which acts as a structure-directing template. The ZnO precursor zinc acetate dihydrate (ZAD) is incorporated into the poly(ethylene oxide) block. Different morphologies are obtained by adjusting the weight fractions of the solvents and ZAD. The sizes of the structure in solution for different sol-gels are probed by means of dynamic light scattering. Thin-film samples with ZnO nanostructures are prepared by spin coating and solution casting followed by a calcination step. On the basis of various selected combinations of weight fractions of the ingredients used, a ternary phase diagram is constructed to show the compositional boundaries of the investigated morphologies. The evolution and formation mechanisms of the morphologies are addressed in brief. The surface morphologies of the ZnO nanostructures are studied with SEM. The inner structures of the samples are probed by means of grazing incidence small-angle X-ray scattering to complement the SEM investigations. XRD measurements confirm the crystallization of the ZnO in the wurtzite phase upon calcination of the nanocomposite film in air. The optical properties of ZnO are analyzed by FTIR and UV/Vis spectroscopy.

  18. Preparation and Photovoltaic Properties of Dye Sensitized Solar Cells Using ZnO Nanorods Stacking Films on AZO Substrate as Photoanode.

    PubMed

    Xu, Yang; Wang, Xina; Liu, Rong; Wang, Hao

    2016-04-01

    Three-dimensional stacking of ZnO nanorods on conducting aluminum-doped ZnO (AZO) glass were studied as efficient photoanodes of dye sensitized solar cells (DSSCs). By changing hydrothermal growth time and cycle times, the thickness of ZnO nanorods stacking films varied from 30 µm to 64 µm, and its influence on the energetic conversion efficiency of the DSSCs based on the stacking films photoanodes was investigated. The loading density of N719 on the surface of ZnO nanorods was studied to increase the efficiency of the cells. Annealing experiments showed that the AZO substrates remained good conductors until heated above 350 °C. A photoelectric conversion efficiency as high as ~2.0% together with ISC of ~9.5 mA/cm2, VOC of ~0.5 V and FF of ~41.4% was achieved for the DSSC using 50 µm-thick film stacking by ZnO nanorods as photoanode and N719 as sensitizer under illumination of AM1.5G solar light (power density of 100 mW/cm2). A charge separation and transfer mechanism was proposed for the ZnO nanorods stacking electrode-based DSSCs.

  19. Comparative Study of As-Deposited ZnO Thin Films by Thermal Evaporation, Pulsed Laser Deposition and RF Sputtering Methods for Electronic and Optoelectronic Applications

    NASA Astrophysics Data System (ADS)

    Vyas, Sumit; Giri, Pushpa; Singh, Shaivalini; Chakrabarti, P.

    2015-10-01

    Zinc oxide (ZnO) thin films have been deposited on Si substrate and glass substrate using thermal evaporation, pulsed laser deposition (PLD) and radio-frequency (RF) sputtering methods. The structural, surface morphological, optical and electrical properties of ZnO thin films deposited by these three methods were investigated and compared systematically using x-ray diffractometer, atomic force microscopy, ellipsometric and current-voltage ( I- V) measurement. The ZnO films deposited by RF sputtering method were highly oriented along the (002) plane. The ZnO films grown by thermal evaporation and PLD methods exhibited a polycrystalline nature. The surface roughness was found to be the least and the transparency in the visible region was the highest for the films grown by the RF sputtering method as compared to the films grown by the other two methods. The I- V characteristics reveal that the Pd:Au/ZnO (RF-sputtered) Schottky contact exhibited a better value of ideality factor, series resistance and barrier height as compared to the values obtained for Pd:Au/ZnO (thermally evaporated and pulse laser-deposited) Schottky contacts. The optical bandgap was found to be almost the same for the films grown by all three methods and was estimated to be around 3.2 eV.

  20. Quantum corrections to temperature dependent electrical conductivity of ZnO thin films degenerately doped with Si

    SciTech Connect

    Das, Amit K. Ajimsha, R. S.; Kukreja, L. M.

    2014-01-27

    ZnO thin films degenerately doped with Si (Si{sub x}Zn{sub 1−x}O) in the concentrations range of ∼0.5% to 5.8% were grown by sequential pulsed laser deposition on sapphire substrates at 400 °C. The temperature dependent resistivity measurements in the range from 300 to 4.2 K revealed negative temperature coefficient of resistivity (TCR) for the 0.5%, 3.8%, and 5.8% doped Si{sub x}Zn{sub 1−x}O films in the entire temperature range. On the contrary, the Si{sub x}Zn{sub 1−x}O films with Si concentrations of 1.0%, 1.7%, and 2.0% showed a transition from negative to positive TCR with increasing temperature. These observations were explained using weak localization based quantum corrections to conductivity.

  1. Behaviour of a ZnO thin film as MSG for biosensing material in sub-wavelength regime

    NASA Astrophysics Data System (ADS)

    Iftimie, N.; Steigmann, R.; Danila, N. A.; Iacomi, F.; Faktorova, D.; Savin, A.

    2016-11-01

    Zinc oxide nanostructured materials, such as films and nanoparticles, could provide a suitable platform for development of high performance biosensing material due to their unique fundamental material properties. In this study, the enzyme biosensing consisting of a zinc oxide (ZnO) nanoparticles were grown on SiO2/Si substrates by vacuum thermal evaporation method and their sensing characteristics are examined in air and investigated. The film morphology is characterized by X-ray diffraction (XRD) the film crystalline quality and by scanning electron microscopy (SEM). Also, the interest in surface waves appeared due to evanescent waves in the metallic strip grating structure (MSG-Ag/ZnO/SiO2/Si) in sub-wavelength regime. Before testing the sensor with metamaterials (MMs) lens in the sub-wavelength regime, a simulation of the evanescent wave's formation has been performed at the edge of Ag strips, with thicknesses in the range of micrometers.

  2. Superconductivity in textured Bi clusters/Bi{sub 2}Te{sub 3} films

    SciTech Connect

    Le, Phuoc Huu; Tzeng, Wen-Yen; Chen, Hsueh-Ju; Luo, Chih Wei; Lin, Jiunn-Yuan; Leu, Jihperng

    2014-09-01

    We report superconductivity at an onset critical temperature below 3.1 K in topological insulator ∼200-nm-thick Bi{sub 2}Te{sub 3} thin films grown by pulsed laser deposition. Using energy-dispersive X-ray spectroscopy elemental mapping and Auger electron spectroscopy elemental depth profiling, we clearly identified bismuth (Bi) precipitation and Bi cluster signatures. Superconductivity in the Bi{sub 2}Te{sub 3} films was attributed to the proximity effect of Bi clusters precipitated on the surface of the Bi{sub 2}Te{sub 3} films.

  3. Second and third order nonlinear optical properties of microrod ZnO films deposited on sapphire substrates by thermal oxidation of metallic zinc

    NASA Astrophysics Data System (ADS)

    Kulyk, B.; Essaidi, Z.; Luc, J.; Sofiani, Z.; Boudebs, G.; Sahraoui, B.; Kapustianyk, V.; Turko, B.

    2007-12-01

    We report the preparation of microcrystalline ZnO thin films on sapphire substrates using a simple method based on the thermal evaporation of metallic Zn in vacuum with further annealing process. The aim of annealing in the oxygen atmosphere in the range of 800-850°C was to obtain the high quality ZnO films. The surface morphology was studied by scanning electron microscopy and atomic force microscopy. The polycrystalline films with ZnO microrods at different stages of their growth were investigated. Second and third harmonic generation measurements were performed by means of the rotational Maker fringe technique using Nd:YAG laser at 1064nm in picosecond regime. The obtained values of second and third order nonlinear susceptibilities were found to be high enough for the potential applications of the investigated materials in the optical switching devices based on refractive index changes.

  4. On the variations of optical property and electronic structure in heavily Al-doped ZnO films during double-step growth process

    SciTech Connect

    Hu, Q. C.; Ding, K. Zhang, J. Y.; Yan, F. P.; Pan, D. M.; Huang, F.; Chiou, J. W.

    2014-01-13

    We have investigated the variations of optical property and electronic structure in heavily Al-doped ZnO (AZO) films during the growth process, which were formed by first creating Zn vacancies in O{sub 2}-rich atmosphere and second filling the vacancies with Zn atoms in Zn-vapor atmosphere. After the first step, the high-resistance AZO films have the same optical bandgap with nominally undoped ZnO, indicating that negligible variations in the fundamental bandgap happened to the AZO films although Al atom was incorporated into the ZnO lattice. After the second step, once free electrons were brought into the lattice by Zn-filling, the optical transition energy blueshifts due to the band-filling effect. X-ray absorption fine structure measurements suggest that Zn-filling process decreased the unoccupied states of the conduction band, but not raised the conduction band minimum.

  5. Electrodeposition of Mg doped ZnO thin film for the window layer of CIGS solar cell

    NASA Astrophysics Data System (ADS)

    Wang, Mang; Yi, Jie; Yang, Sui; Cao, Zhou; Huang, Xiaopan; Li, Yuanhong; Li, Hongxing; Zhong, Jianxin

    2016-09-01

    Mg doped ZnO (ZMO) film with the tunable bandgap can adjust the conduction band offset of the window/chalcopyrite absorber heterointerface to positive to reduce the interface recombination and resulting in an increasement of chalcopyrite based solar cell efficiency. A systematic study of the effect of the electrodeposition potential on morphology, crystalline structure, crystallographic orientation and optical properties of ZMO films was investigated. It is interestingly found that the prepared doped samples undergo a significant morphological change induced by the deposition potential. With negative shift of deposition potential, an obvious morphology evolution from nanorod structrue to particle covered films was observed. A possible growth mechanism for explaining the morphological change is proposed and briefly discussed. The combined optical techniques including absorption, transmission and photoluminescence were used to study the obtained ZMO films deposited at different potential. The sample deposited at -0.9 V with the hexagonal nanorods morphology shows the highest optical transparency of 92%. The photoluminescence spectra reveal that the crystallization of the hexagonal nanorod ZMO thin film deoposited at -0.9 V is much better than the particles covered ZMO thin film. Combining the structural and optical properties analysis, the obtained normal hexagonal nanorod ZMO thin film could potentially be useful in nanostructured chalcopyrite solar cells to improve the device performance.

  6. Highly transparent and conductive Al-doped ZnO nanoparticulate thin films using direct write processing.

    PubMed

    Vunnam, S; Ankireddy, K; Kellar, J; Cross, W

    2014-05-16

    Solution processable Al-doped ZnO (AZO) thin films are attractive candidates for low cost transparent electrodes. We demonstrate here an optimized nanoparticulate ink for the fabrication of AZO thin films using scalable, low-cost direct write processing (ultrasonic spray deposition) in air at atmospheric pressure. The thin films were made via thermal processing of as-deposited films. AZO films deposited using the proposed nanoparticulate ink with further reducing in vacuum and rf plasma of forming gas exhibited optical transparency greater than 95% across the visible spectrum, and electrical resistivity of 0.5 Ω cm and it drops down to 7.0 × 10(-2) Ω cm after illuminating with UV light, which is comparable to commercially available tin doped indium oxide colloidal coatings. Various structural analyses were performed to investigate the influence of ink chemistry, deposition parameters, and annealing temperatures on the structural, optical, and electrical characteristics of the spray deposited AZO thin films. Optical micrographs confirmed the presence of surface defects and cracks using the AZO NPs ink without any additives. After adding N-(2-Aminoethyl)-3-aminopropylmethyldimethoxy silane to the ink, AZO films exhibited an optical transparency which was virtually identical to that of the plain glass substrate.

  7. ZnO films on /001/-cut (110)-propagating GaAs substrates for surface acoustic wave device applications

    NASA Technical Reports Server (NTRS)

    Hickernell, Frederick S.; Higgins, Robert J.; Jen, Cheng-Kuei; Kim, Yoonkee; Hunt, William D.

    1995-01-01

    A potential application for piezoelectric films substrates is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Knowledge of the SAW properties of the layered structure is critical for the optimum and accurate design of such devices. The acoustic properties of ZnO films sputtered on /001/-cut group of (110) zone axes-propagating GaAs substrates are investigated in this article, including SAW velocity, effective piezoelectric coupling constant, propagation loss, diffraction, velocity surface, and reflectivity of shorted and open metallic gratings. The measurements of these essential SAW properties for the frequency range between 180 and 360 MHz have been performed using a knife-edge laser probe for film thicknesses over the range of 1.6-4 micron and with films of different grain sizes. The high quality of dc triode sputtered films was observed as evidenced by high K(sup 2) and low attenuation. The measurements of the velocity surface, which directly affects the SAW diffraction, on the bare and metalized ZnO on SiO2 or Si3N4 on /001/-cut GaAs samples are reported using two different techniques: (1) knife-edge laser probe, (2) line-focus-beam scanning acoustic microscope. It was found that near the group of (110) zone axes propagation direction, the focusing SAW property of the bare GaAs changes into a nonfocusing one for the layered structure, but a reversed phenomenon exists near the (100) direction. Furthermore, to some extent the diffraction of the substrate can be controlled with the film thickness. The reflectivity of shorted and open gratings are also analyzed and measured. Zero reflectivity is observed for a shorted grating. There is good agreement between the measured data and theoretical values.

  8. ZnO Films on {001}-Cut <110>-Propagating GaAs Substrates for Surface Acoustic Wave Device Applications

    NASA Technical Reports Server (NTRS)

    Kim, Yoonkee; Hunt, William D.; Hickernell, Frederick S.; Higgins, Robert J.; Jen, Cheng-Kuei

    1995-01-01

    A potential application for piezoelectric films on GaAs substrates is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Knowledge of the SAW properties of the layered structure is critical for the optimum and accurate design of such devices. The acoustic properties of ZnO films sputtered on {001}-cut <110> -propagating GaAs substrates are investigated in this article, including SAW Velocity effective piezoelectric coupling constant, propagation loss. diffraction, velocity surface, and reflectivity of shorted and open metallic gratings. The measurements of these essential SAW properties for the frequency range between 180 and 360 MHz have been performed using a knife-edge laser probe for film thicknesses over the range of 1.6-4 micron and with films or different grain sizes. The high quality of dc triode sputtered films was observed as evidenced by high K(exp 2) and low attenuation. The measurements of the velocity surface, which directly affects the SAW diffraction, on the bare and metalized ZnO on SiO2, or Si3N4 on {001}-cut GaAs samples are reported using two different techniques: 1) knife-edge laser probe, 2) line-focus-beam scanning acoustic microscope. It was found that near the <110> propagation direction, the focusing SAW property of the bare GaAs changes into a nonfocusing one for the layered structure, but a reversed phenomenon exists near the <100> direction. Furthermore, to some extent the diffraction of the substrate can be controlled with the film thickness. The reflectivity of shorted and open gratings are also analyzed and measured. Zero reflectivity is observed for a shorted grating. There is good agreement between the measured data and theoretical values.

  9. Energy dissipation channels affecting photoluminescence from resonantly excited Er{sup 3+} ions doped in epitaxial ZnO host films

    SciTech Connect

    Akazawa, Housei; Shinojima, Hiroyuki

    2015-04-21

    We identified prerequisite conditions to obtain intense photoluminescence at 1.54 μm from Er{sup 3+} ions doped in ZnO host crystals. The epitaxial ZnO:Er films were grown on sapphire C-plane substrates by sputtering, and Er{sup 3+} ions were resonantly excited at a wavelength of 532 nm between energy levels of {sup 4}I{sub 15/2} and {sup 2}H{sub 11/2}. There is a threshold deposition temperature between 500 and 550 °C, above which epitaxial ZnO films become free of miss-oriented domains. In this case, Er{sup 3+} ions are outside ZnO crystallites, having the same c-axis lattice parameters as those of undoped ZnO crystals. The improved crystallinity was correlated with enhanced emissions peaking at 1538 nm. Further elevating the deposition temperature up to 650 °C generated cracks in ZnO crystals to relax the lattice mismatch strains, and the emission intensities from cracked regions were three times as large as those from smooth regions. These results can be consistently explained if we assume that emission-active Er{sup 3+} ions are those existing at grain boundaries and bonded to single-crystalline ZnO crystallites. In contrast, ZnO:Er films deposited on a ZnO buffer layer exhibited very weak emissions because of their degraded crystallinity when most Er{sup 3+} ions were accommodated into ZnO crystals. Optimizing the degree of oxidization of ZnO crystals is another important factor because reduced films suffer from non-radiative decay of excited states. The optimum Er content to obtain intense emissions was between 2 and 4 at. %. When 4 at. % was exceeded, the emission intensity was severely attenuated because of concentration quenching as well as the degradation in crystallinity. Precipitation of Er{sub 2}O{sub 3} crystals was clearly observed at 22 at. % for films deposited above 650 °C. Minimizing the number of defects and impurities in ZnO crystals prevents energy dissipation, thus exclusively utilizing the excitation energy to emissions from

  10. Structural optical and electronic properties of Fe and Ga doped ZnO thin films grown using pulsed laser deposition technique

    NASA Astrophysics Data System (ADS)

    Singh, Karmvir; Shukla, D. K.; Majid, S.; Dhar, R.; Choudhary, R. J.; Phase, D. M.

    2016-10-01

    Band gap engineering in ZnO thin films have been subject of intensive studies. The thin films of 2 wt % Fe and 2 wt % Ga doped ZnO and undoped ZnO were deposited on glass substrate by pulse laser deposition technique. Structural, optical and electronic structure properties of these thin films were investigated by X- Ray diffraction (XRD), UV-Vis spectroscopy and X-ray absorption spectroscopy (XAS), respectively. XRD studies show that all the thin films are highly oriented along the c-axis and maintain the wurtzite structure. Out of plane lattice parameter in Ga doped is smaller while in Fe doped is larger, compared to undoped ZnO. The band gaps of doped films have been found to increase due to doping of the Ga and Fe ions. XAS studies across O K edges of doped thin films show that the conduction band edge structure probed via oxygen 1s to 2p transitions have modified significantly in Ga doped sample.

  11. Impact of low temperature annealing on structural, optical, electrical and morphological properties of ZnO thin films grown by RF sputtering for photovoltaic applications

    NASA Astrophysics Data System (ADS)

    Purohit, Anuradha; Chander, S.; Sharma, Anshu; Nehra, S. P.; Dhaka, M. S.

    2015-11-01

    This paper presents effect of low temperature annealing on the physical properties of ZnO thin films for photovoltaic applications. The thin films of thickness 50 nm were grown on glass and indium tin oxide (ITO) coated glass substrates employing radio frequency magnetron sputtering technique followed by thermal annealing within low temperature range 150-450 °C. These as-grown and annealed films were subjected to the X-ray diffraction (XRD), UV-Vis spectrophotometer, source meter and scanning electron microscopy (SEM) for structural, optical, electrical and surface morphological analysis respectively. The compositional analysis of the as-grown ZnO film was also carried out using energy dispersive spectroscopy (EDS). The XRD patterns reveal that the films have wurtzite structure of hexagonal phase with preferred orientation (1 0 0) and polycrystalline in nature. The crystallographic and optical parameters are calculated and discussed in detail. The optical band gap was found in the range 3.30-3.52 eV and observed to decrease with annealing temperature except 150 °C. The current-voltage characteristics show that the films exhibit approximately ohmic behavior. The SEM studies show that the films are uniform, homogeneous and free from crystal defects and voids. The experimental results reveal that ZnO thin films may be used as alternative materials for eco-friendly buffer layer to the thin film solar cell applications.

  12. Induced conductivity in sol-gel ZnO films by passivation or elimination of Zn vacancies

    NASA Astrophysics Data System (ADS)

    Winarski, D. J.; Anwand, W.; Wagner, A.; Saadatkia, P.; Selim, F. A.; Allen, M.; Wenner, B.; Leedy, K.; Allen, J.; Tetlak, S.; Look, D. C.

    2016-09-01

    Undoped and Ga- and Al- doped ZnO films were synthesized using sol-gel and spin coating methods and characterized by X-ray diffraction, high-resolution scanning electron microscopy (SEM), optical spectroscopy and Hall-effect measurements. SEM measurements reveal an average grain size of 20 nm and distinct individual layer structure. Measurable conductivity was not detected in the unprocessed films; however, annealing in hydrogen or zinc environment induced significant conductivity (˜10-2 Ω .cm) in most films. Positron annihilation spectroscopy measurements provided strong evidence that the significant enhancement in conductivity was due to hydrogen passivation of Zn vacancy related defects or elimination of Zn vacancies by Zn interstitials which suppress their role as deep acceptors. Hydrogen passivation of cation vacancies is shown to play an important role in tuning the electrical conductivity of ZnO, similar to its role in passivation of defects at the Si/SiO2 interface that has been essential for the successful development of complementary metal-oxide-semiconductor (CMOS) devices. By comparison with hydrogen effect on other oxides, we suggest that hydrogen may play a universal role in oxides passivating cation vacancies and modifying their electronic properties.

  13. Characterization of Al-As codoped p-type ZnO films by magnetron cosputtering deposition

    SciTech Connect

    Yun, Eui-Jung; Park, Hyeong-Sik; Lee, Kyu H.; Nam, Hyoung G.; Jung, Myunghee

    2008-04-01

    We report the preparation of Al-As codoped p-type ZnO films by rf magnetron cosputtering deposition. The p-type conductivity of the films was revealed by Hall measurements, x-ray photoelectron spectroscopy (XPS), and photoluminescence measurements after being annealed in O{sub 2}. It was observed by XPS that Al content increased with increasing AlAs target power from 80 to 160 W and reached a maximum value at an AlAs target power of 160 W. Hole concentration decreased with increasing Al content. With increasing AlAs target power greater than 160 W, the samples exhibit increases in As and O contents and decreases in Al and Zn contents, which contribute to the increase in hole concentration. A high hole concentration of 2.354x10{sup 20} cm{sup -3}, a low resistivity of 2.122x10{sup -2} {omega} cm, and a Hall mobility of 0.13 cm{sup 2}/V s for the films with high As content of 16.59% were obtained. XPS has also been used to address the unresolved issues related to the p-type formation mechanism of As-doped ZnO, supporting that the acceptor is As{sub Zn}-2V{sub Zn}.

  14. Visible tunable lighting system based on polymer composites embedding ZnO and metallic clusters: from colloids to thin films

    PubMed Central

    Truong, Thai Giang; Dierre, Benjamin; Grasset, Fabien; Saito, Noriko; Saito, Norio; Nguyen, Thi Kim Ngan; Takahashi, Kohsei; Uchikoshi, Tetsuo; Amela-Cortes, Marian; Molard, Yann; Cordier, Stéphane; Ohashi, Naoki

    2016-01-01

    Abstract The development of phosphor devices free of heavy metal or rare earth elements is an important issue for environmental reasons and energy efficiency. Different mixtures of ZnO nanocrystals with Cs2Mo6I8(OOC2F5)6 cluster compound (CMIF) dispersed into polyvinylpyrrolidone matrix have been prepared by very simple and low cost solution chemistry. The resulting solutions have been used to fabricate highly transparent and luminescent films by dip coating free of heavy metal or rare earth elements. The luminescence properties of solution and dip-coated films were investigated. The luminescence of such a system is strongly dependent on the ratios between ZnO and CMIF amounts, the excitation wavelength and the nature of the system. By varying these two parameters (ratio and wavelength), a large variety of colors, from blue to red as well as white, can be achieved. In addition, differences in the luminescence properties have been observed between solutions and thin films as well as changes of CMIF emission band maximum wavelength. This may suggest some possible interactions between the different luminophore centers, such as energy transfer or ligands exchange on the Mo6 clusters. PMID:27877895

  15. Resistive switching: An investigation of the bipolar–unipolar transition in Co-doped ZnO thin films

    SciTech Connect

    Santos, Daniel A.A.; Zeng, Hao; Macêdo, Marcelo A.

    2015-06-15

    Highlights: • A purely bipolar behavior on a Co-doped ZnO thin film has been demonstrated. • We have shown what can happen if a unipolar test is performed in a purely bipolar device. • An explanation for how a sample can show a purely bipolar switching behavior was suggested. • An important open issue about resistive switching effect was put in debate. - Abstract: In order to investigate the resistive switching effect we built devices in a planar structure in which two Al contacts were deposited on the top of the film and separated by a small gap using a shadow mask. Therefore, two samples of 10% Co-doped ZnO thin films were sputtered on glass substrate. High resolution X-ray diffraction (HRXRD) revealed a highly c-axis oriented crystalline structure, without secondary phase. The high resolution scanning electron microscopy (HRSEM) showed a flat surface with good coverage and thickness about 300 nm. A Keithley 2425 semiconductor characterization system was used to perform the resistive switching tests in the bipolar and unipolar modes. Considering only the effect of compliance current (CC), the devices showed a purely bipolar behavior since an increase in CC did not induce a transition to unipolar behavior.

  16. Effects of rapid thermal annealing on the structural and local atomic properties of ZnO: Ge nanocomposite thin films

    SciTech Connect

    Ceylan, Abdullah Ozcan, Sadan; Rumaiz, Abdul K.; Caliskan, Deniz; Ozbay, Ekmel; Woicik, J. C.

    2015-03-14

    We have investigated the structural and local atomic properties of Ge nanocrystals (Ge-ncs) embedded ZnO (ZnO: Ge) thin films. The films were deposited by sequential sputtering of ZnO and Ge thin film layers on z-cut quartz substrates followed by an ex-situ rapid thermal annealing (RTA) at 600 °C for 30, 60, and 90 s under forming gas atmosphere. Effects of RTA time on the evolution of Ge-ncs were investigated by x-ray diffraction (XRD), scanning electron microscopy (SEM), hard x-ray photoelectron spectroscopy (HAXPES), and extended x-ray absorption fine structure (EXAFS). XRD patterns have clearly shown that fcc diamond phase Ge-ncs of sizes ranging between 18 and 27 nm are formed upon RTA and no Ge-oxide peak has been detected. However, cross-section SEM images have clearly revealed that after RTA process, Ge layers form varying size nanoclusters composed of Ge-ncs regions. EXAFS performed at the Ge K-edge to probe the local atomic structure of the Ge-ncs has revealed that as prepared ZnO:Ge possesses Ge-oxide but subsequent RTA leads to crystalline Ge structure without the oxide layer. In order to study the occupied electronic structure, HAXPES has been utilized. The peak separation between the Zn 2p and Ge 3d shows no significant change due to RTA. This implies little change in the valence band offset due to RTA.

  17. Li induced enhancement in c-axis orientation and its effect on structural, optical, and electrical properties of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Ali, Dilawar; Butt, M. Z.; Arif, Bilal; Al-Sehemi, Abdullah G.; Al-Ghamdi, Ahmed A.; Yakuphanoglu, Fahrettin

    2017-02-01

    Un-doped and Li-doped ZnO thin films with high c-texture have been deposited on glass substrate using sol–gel spin coating method. The effect of Li dopant in concentration range 1–5 at.% on the structural, optical, morphological, and electrical properties of ZnO thin films were analyzed using x-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), UV–VIS spectrophotometer, field emission scanning electron microscopy (FESEM), and two point probe method, respectively. XRD analysis reveals that all thin films possess hexagonal wurtzite structure and (0 0 2) preferred orientation. X-ray diffraction intensity and crystallite size appertaining to (0 0 2) plane increases with the increase in Li concentration. FESEM micrographs shows that morphology of all thin films consist of spherical and non-spherical shaped grains. Surface roughness of the films decreases on increasing Li dopant concentration. Average transmittance in visible region is 90.6  ±  0.5 % for all Li-doped ZnO thin films. Blue shift, i.e. widening of optical band gap (E g) has been observed on doping with Li. Urbach energy (E u) was found to decrease on Li incorporation. Both E g and E u correlate well with variation in c-texture and crystallite size. The average refractive index of ZnO thin films in the visible region is decreased on doping with Li. Electrical conductivity of ZnO thin films is enhanced on increase in Li dopant concentration. The improvement in electrical conductivity also correlates well with increase in c-texture and crystallite size. FTIR spectra portray characteristic absorption bands centered at 901, 760, 602, and 568 cm‑1 pertaining to metal–oxygen bonds.

  18. Wettability behavior of special microscale ZnO nail-coated mesh films for oil-water separation.

    PubMed

    Du, Xin; Huang, Xing; Li, Xiaoyu; Meng, Xiangmin; Yao, Lin; He, Junhui; Huang, Hongwei; Zhang, Xueji

    2015-11-15

    The surface free energy and geometrical structure are two important factors to govern the surface wettability. However, the design and simple synthesis of materials with specific surface free energy and geometrical structure, and their elaborate regulations are still a key challenge. Herein, through one-step thermal evaporation method, we successfully synthesized aligned arrays of highly crystallized ZnO with modulated nail structures on the stainless steel meshes for the first time. Owing to the decoration of [0001] oriented nail structures, the wire surface of meshes were indeed enclosed by the ZnO (0002) facets, which had the lowest surface energy in wurtzite structure. Under no any further modifications, just by regulating the nail structure and density as well as the mesh pore sizes, we not only obtained ZnO nail-coated mesh with hydrophobic, oleophilic (oil penetration), and underwater oleophilic properties, but also fabricated one with hydrophilic (water penetration), oleophilic (oil penetration), and underwater superoleophobic properties. Furthermore, interestingly, the separation of oil and water mixture was realized by utilizing two ZnO-nail coated meshes with different wettability. The underlying mechanism was investigated and discussed in the work. Therefore, our study provides interesting insight into the design of novel functional films with desired surface wettability for the separation of oil-water mixture.

  19. Impurity distribution and microstructure of Ga-doped ZnO films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Kvit, A. V.; Yankovich, A. B.; Avrutin, V.; Liu, H.; Izyumskaya, N.; Özgür, Ü.; Morkoç, H.; Voyles, P. M.

    2012-12-01

    We report microstructural characterization of heavily Ga-doped ZnO (GZO) thin films on GaN and sapphire by aberration-corrected scanning transmission electron microscopy. Growth under oxygen-rich and metal-rich growth conditions leads to changes in the GZO polarity and different extended defects. For GZO layers on sapphire, the primary extended defects are voids, inversion domain boundaries, and low-angle grain boundaries. Ga doping of ZnO grown under metal-rich conditions causes a switch from pure oxygen polarity to mixed oxygen and zinc polarity in small domains. Electron energy loss spectroscopy and energy dispersive spectroscopy spectrum imaging show that Ga is homogeneous, but other residual impurities tend to accumulate at the GZO surface and at extended defects. GZO grown on GaN on c-plane sapphire has Zn polarity and no voids. There are misfit dislocations at the interfaces between GZO and an undoped ZnO buffer layer and at the buffer/GaN interface. Low-angle grain boundaries are the only threading microstructural defects. The potential effects of different extended defects and impurity distributions on free carrier scattering are discussed.

  20. Atomic-layer-deposition-assisted ZnO nanoparticles for oxide charge-trap memory thin-film transistors

    NASA Astrophysics Data System (ADS)

    Seo, Gi Ho; Yun, Da Jeong; Lee, Won Ho; Yoon, Sung Min

    2017-02-01

    ZnO nanoparticles (NPs) with monolayer structures were prepared by atomic layer deposition (ALD) to use for a charge-trap layer (CTL) for nonvolatile memory thin-film transistors (MTFTs). The optimum ALD temperature of the NP formation was demonstrated to be 160 °C. The size and areal density of the ZnO NPs was estimated to be approximately 33 nm and 4.8 × 109 cm-2, respectively, when the number of ALD cycles was controlled to be 20. The fabricated MTFTs using a ZnO-NP CTL exhibited typical memory window properties, which are generated by charge-trap/de-trap processes, in their transfer characteristics and the width of the memory window (MW) increased from 0.6 to 18.0 V when the number of ALD cycles increased from 5 to 30. The program characteristics of the MTFT were markedly enhanced by the post-annealing process performed at 180 °C in an oxygen ambient due to the improvements in the interface and bulk qualities of the ZnO NPs. The program/erase (P/E) speed was estimated to be 10 ms at P/E voltages of -14 and 17 V. The memory margin showed no degradation with the lapse in retention time for 2 × 104 s and after the repetitive P/E operations of 7 × 103 cycles.

  1. c-axis inclined ZnO films for shear-wave transducers deposited by reactive sputtering using an additional blind

    SciTech Connect

    Link, M.; Schreiter, M.; Weber, J.; Gabl, R.; Pitzer, D.; Primig, R.; Wersing, W.; Assouar, M.B.; Elmazria, O.

    2006-03-15

    This article reports on the growth and characterization of polycrystalline ZnO films having c axis inclined up to 16 deg. with respect to the substrate normal. These films allow the excitation of shear and longitudinal waves with comparable electromechanical coupling constants and are of significant interest for thin film bulk acoustic resonators (FBARs). The films are deposited on silicon substrates covered by Al{sub 2}O{sub 3} and SiO{sub 2} buffer layers under low pressure using a modified reactive dc-pulsed magnetron sputtering system. A blind has been positioned between target and substrate, allowing oblique particle incidence without tilting the wafer. The study of structural properties of the deposited ZnO films by x-ray diffraction and scanning electron microscopy has permitted to show the presence of the inclined structure. Electromechanical coupling constants K up to 13% have been extracted for shear-mode excitation using highly overmoded FBARs.

  2. Surface modification of a polyimide gate insulator with an yttrium oxide interlayer for aqueous-solution-processed ZnO thin-film transistors.

    PubMed

    Jang, Kwang-Suk; Wee, Duyoung; Kim, Yun Ho; Kim, Jinsoo; Ahn, Taek; Ka, Jae-Won; Yi, Mi Hye

    2013-06-11

    We report a simple approach to modify the surface of a polyimide gate insulator with an yttrium oxide interlayer for aqueous-solution-processed ZnO thin-film transistors. It is expected that the yttrium oxide interlayer will provide a surface that is more chemically compatible with the ZnO semiconductor than is bare polyimde. The field-effect mobility and the on/off current ratio of the ZnO TFT with the YOx/polyimide gate insulator were 0.456 cm(2)/V·s and 2.12 × 10(6), respectively, whereas the ZnO TFT with the polyimide gate insulator was inactive.

  3. Improved Resistance Switching Stability in Fe-Doped ZnO Thin Films Through Pulsed Magnetic Field Annealing.

    PubMed

    Xu, Hongtao; Wu, Changjin; Xiahou, Zhao; Jung, Ranju; Li, Ying; Liu, Chunli

    2017-12-01

    Five percent of Fe-doped ZnO (ZnO:Fe) thin films were deposited on Pt/TiO2/SiO2/Si substrates by a spin-coating method. The films were annealed without (ZnO:Fe-0T) and with a pulsed magnetic field of 4 T (ZnO:Fe-4TP) to investigate the magnetic annealing effect on the resistance switching (RS) behavior of the Pt/ZnO:Fe/Pt structures. Compared with the ZnO:Fe-0T film, the ZnO:Fe-4TP film showed improved RS performance regarding the stability of the set voltage and the resistance of the high resistance state. Transmission electron microscopy and X-ray photoelectron spectroscopy analyses revealed that the ZnO:Fe-4TP film contains more uniform grains and a higher density of oxygen vacancies, which promote the easier formation of conducting filaments along similar paths and the stability of switching parameters. These results suggest that external magnetic fields can be used to prepare magnetic oxide thin films with improved resistance switching performance for memory device applications.

  4. Improved Resistance Switching Stability in Fe-Doped ZnO Thin Films Through Pulsed Magnetic Field Annealing

    NASA Astrophysics Data System (ADS)

    Xu, Hongtao; Wu, Changjin; Xiahou, Zhao; Jung, Ranju; Li, Ying; Liu, Chunli

    2017-03-01

    Five percent of Fe-doped ZnO (ZnO:Fe) thin films were deposited on Pt/TiO2/SiO2/Si substrates by a spin-coating method. The films were annealed without (ZnO:Fe-0T) and with a pulsed magnetic field of 4 T (ZnO:Fe-4TP) to investigate the magnetic annealing effect on the resistance switching (RS) behavior of the Pt/ZnO:Fe/Pt structures. Compared with the ZnO:Fe-0T film, the ZnO:Fe-4TP film showed improved RS performance regarding the stability of the set voltage and the resistance of the high resistance state. Transmission electron microscopy and X-ray photoelectron spectroscopy analyses revealed that the ZnO:Fe-4TP film contains more uniform grains and a higher density of oxygen vacancies, which promote the easier formation of conducting filaments along similar paths and the stability of switching parameters. These results suggest that external magnetic fields can be used to prepare magnetic oxide thin films with improved resistance switching performance for memory device applications.

  5. Transparent conducting Si-codoped Al-doped ZnO thin films prepared by magnetron sputtering using Al-doped ZnO powder targets containing SiC

    SciTech Connect

    Nomoto, Jun-ichi; Miyata, Toshihiro; Minami, Tadatsugu

    2009-07-15

    Transparent conducting Al-doped ZnO (AZO) thin films codoped with Si, or Si-codoped AZO (AZO:Si), were prepared by radio-frequency magnetron sputtering using a powder mixture of ZnO, Al{sub 2}O{sub 3}, and SiC as the target; the Si content (Si/[Si+Zn] atomic ratio) was varied from 0 to 1 at. %, but the Al content (Al/[Al+Zn] atomic ratio) was held constant. To investigate the effect of carbon on the electrical properties of AZO:Si thin films prepared using the powder targets containing SiC, the authors also prepared thin films using a mixture of ZnO, Al{sub 2}O{sub 3}, and SiO{sub 2} or SiO powders as the target. They found that when AZO:Si thin films were deposited on glass substrates at about 200 degree sign C, both Al and Si doped into ZnO acted as effective donors and the atomic carbon originating from the sputtered target acted as a reducing agent. As a result, sufficient improvement was obtained in the spatial distribution of resistivity on the substrate surface in AZO:Si thin films prepared with a Si content (Si/[Si+Zn] atomic ratio) of 0.75 at. % using powder targets containing SiC. The improvement in resistivity distribution was mainly attributed to increases in both carrier concentration and Hall mobility at locations on the substrate corresponding to the target erosion region. In addition, the resistivity stability of AZO: Si thin films exposed to air for 30 min at a high temperature was found to improve with increasing Si content.

  6. Influence of Thickness on Ethanol Sensing Characteristics of Doctor-bladed Thick Film from Flame-made ZnO Nanoparticles

    PubMed Central

    Liewhiran, Chaikarn; Phanichphant, Sukon

    2007-01-01

    ZnO nanoparticles were produced by flame spray pyrolysis (FSP) using zinc naphthenate as a precursor dissolved in toluene/acetonitrile (80/20 vol%). The particle properties were analyzed by XRD, BET, and HR-TEM. The sensing films were produced by mixing the particles into an organic paste composed of terpineol and ethyl cellulose as a vehicle binder and were fabricated by doctor-blade technique with various thicknesses (5, 10, 15 μm). The morphology of the sensing films was analyzed by SEM and EDS analyses. The gas sensing characteristics to ethanol (25-250 ppm) were evaluated as a function of film thickness at 400°C in dry air. The relationship between thickness and ethanol sensing characteristics of ZnO thick film on Al2O3 substrate interdigitated with Au electrodes were investigated. The effects of film thickness, as well as the cracking phenomenon, though, many cracks were observed for thicker sensing films. Crack widths increased with increasing film thickness. The film thickness, cracking and ethanol concentration have significant effect on the sensing characteristics. The sensing characteristics with various thicknesses were compared, showing the tendency of the sensitivity to ethanol decreased with increasing film thickness and response time. The relationship between gas sensing properties and film thickness was discussed on the basis of diffusively and reactivity of the gases inside the oxide films. The thinnest sensing film (5 μm) showed the highest sensitivity and the fastest response time (within seconds).

  7. Controlling the orientation of ZnO nanorod arrays using TiO2 thin film templates dip-coated by sol-gel

    NASA Astrophysics Data System (ADS)

    Yang, Anli; Cui, Zuolin

    2007-04-01

    The oriented ZnO nanorod arrays have been synthesized on a silicon wafer that coated with TiO2 films by aqueous chemical method. The morphologies, phase structure and the photoluminescence (PL) properties of the as-obtained product were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffractometer (XRD), transmission electron microscope (TEM) and PL spectrum. The nanorods were about 100 nm in diameter and more than 1 µm in length, which possessed wurtzite structure with a c axis growth direction. The room-temperature PL measurement of the nanorod arrays showed strong ultraviolet emission. The effect of the crystal structure and the thickness of TiO2 films on the morphologies of ZnO nanostructures were investigated. It was found that the rutile TiO2 films were appropriate to the oriented growth of ZnO nanorod arrays in comparison with anatase TiO2 films. Moreover, flakelike ZnO nanostructures were obtained with increasing the thickness of anatase TiO2 films.

  8. Temperature Dependent Thermal Conductivity and Elastic Properties of a-InGaZnO4 and a-In2Ga2ZnO7 Thin Films

    NASA Astrophysics Data System (ADS)

    Thompson, W. D.; White, B. E.

    2016-10-01

    Amorphous In-Ga-Zn-O is an important oxide semiconductor in advanced display technologies. Despite its importance, little has been reported on the thermal and elastic properties of this material. Here, the temperature dependence of the thermal conductivity, shear modulus, and internal friction of a-InGaZnO4 and a-In2Ga2ZnO7 films are presented. The thermal conductivity of a-In2Ga2ZnO7, measured from 100 K to room temperature, was found to be larger than that of a-InGaZnO4 over the entire temperature range. At room temperature the thermal conductivities were 1.9 W/m K and 1.4 W/m K for the a-In2Ga2ZnO7 and a-InGaZnO4 films, respectively. The shear modulus and internal friction of these films were measured in the temperature range of 340 mK to 65 K. At 4.2 K the shear modulus of the a-InGaZnO4 and a-In2 Ga2ZnO7 films was 44 GPa and 42 GPa, respectively. The internal friction of thin films at each composition exhibited a temperature dependence and magnitude that is in agreement with that observed in all amorphous solids. As the self-heating effect is of concern in the development of amorphous In-Ga-Zn-O based thin film transistors on low thermal conductivity substrates, a thermal model of such a device utilizing a-In2Ga2ZnO7 or a-InGaZnO4 as the active layer was explored. It was found that the temperature increase of the thin film transistor channel is essentially independent of the thermal conductivity of the active layer.

  9. Electrical and optical properties of Al-doped ZnO and ZnAl2O4 films prepared by atomic layer deposition

    PubMed Central

    2013-01-01

    ZnO/Al2O3 multilayers were prepared by alternating atomic layer deposition (ALD) at 150°C using diethylzinc, trimethylaluminum, and water. The growth process, crystallinity, and electrical and optical properties of the multilayers were studied with a variety of the cycle ratios of ZnO and Al2O3 sublayers. Transparent conductive Al-doped ZnO films were prepared with the minimum resistivity of 2.4 × 10−3 Ω·cm at a low Al doping concentration of 2.26%. Photoluminescence spectroscopy in conjunction with X-ray diffraction analysis revealed that the thickness of ZnO sublayers plays an important role on the priority for selective crystallization of ZnAl2O4 and ZnO phases during high-temperature annealing ZnO/Al2O3 multilayers. It was found that pure ZnAl2O4 film was synthesized by annealing the specific composite film containing alternative monocycle of ZnO and Al2O3 sublayers, which could only be deposited precisely by utilizing ALD technology. PMID:23537274

  10. Solvent-assisted microstructural evolution and enhanced performance of porous ZnO films for plastic dye-sensitized solar cells

    NASA Astrophysics Data System (ADS)

    Ohashi, Hitomi; Hagiwara, Manabu; Fujihara, Shinobu

    2017-02-01

    A low-temperature process for fabricating porous ZnO films on plastic, indium tin oxide-coated polyethylene naphthalate substrates is developed for their use in dye-sensitized solar cells. A special attention is paid to modification of microscopic morphologies for enhancing interparticle connection. ZnO films having two kinds of macroscopic morphologies (flower-like particles and densely packed nanoparticles) are fabricated at temperatures below the heatproof temperature of the substrate, and subsequently immersed in mixed solvents composed of water and ethanol at 90 °C. The immersion leads to the growth of constituting ZnO particles and also the evolution of interparticle connection, depending on solvent compositions. The cell performance is largely improved especially in a short-circuit current density and a power conversion efficiency. The immersion effect is more remarkable for the cell using the densely packed ZnO film, with a 62% increase in the current density and an 84% increase in the conversion efficiency. In consequence, our plastic N719-sensitized ZnO cell shows the conversion efficiency as high as 4.1%.

  11. Bi-layer channel structure-based oxide thin-film transistors consisting of ZnO and Al-doped ZnO with different Al compositions and stacking sequences

    NASA Astrophysics Data System (ADS)

    Cho, Sung Woon; Yun, Myeong Gu; Ahn, Cheol Hyoun; Kim, So Hee; Cho, Hyung Koun

    2015-03-01

    Zinc oxide (ZnO)-based bi-layers, consisting of ZnO and Al-doped ZnO (AZO) layers grown by atomic layer deposition, were utilized as the channels of oxide thin-film transistors (TFTs). Thin AZO layers (5 nm) with different Al compositions (5 and 14 at. %) were deposited on top of and beneath the ZnO layers in a bi-layer channel structure. All of the bi-layer channel TFTs that included the AZO layers showed enhanced stability (Δ V Th ≤ 3.2 V) under a positive bias stress compared to the ZnO single-layer channel TFT (Δ V Th = 4.0 V). However, the AZO/ZnO bi-layer channel TFTs with an AZO interlayer between the gate dielectric and the ZnO showed a degraded field effect mobility (0.3 cm2/V·s for 5 at. % and 1.8 cm2/V·s for 14 at. %) compared to the ZnO single-layer channel TFT (5.5 cm2/V·s) due to increased scattering caused by Al-related impurities near the gate dielectric/channel interface. In contrast, the ZnO/AZO bi-layer channel TFTs with an AZO layer on top of the ZnO layer exhibited an improved field effect mobility (7.8 cm2/V·s for 14 at. %) and better stability. [Figure not available: see fulltext.

  12. Polarity characterization by anomalous x-ray dispersion of ZnO films and GaN lateral polar structures

    SciTech Connect

    Shelton, Christopher T.; Sachet, Edward; Paisley, Elizabeth A.; Hoffmann, Marc P.; Rajan, Joseph; Collazo, Ramón; Sitar, Zlatko; Maria, Jon-Paul

    2014-01-28

    We demonstrate the use of anomalous x-ray scattering of constituent cations at their absorption edge, in a conventional Bragg-Brentano diffractometer, to measure absolutely and quantitatively the polar orientation and polarity fraction of unipolar and mixed polar wurtzitic crystals. In one set of experiments, the gradual transition between c+ and c− polarity of epitaxial ZnO films on sapphire as a function of MgO buffer layer thickness is monitored quantitatively, while in a second experiment, we map the polarity of a lateral polar homojunction in GaN. The dispersion measurements are compared with piezoforce microscopy images, and we demonstrate how x-ray dispersion and scanning probe methods can provide complementary information that can discriminate between polarity fractions at a material surface and polarity fractions averaged over the film bulk.

  13. Table top surface plasmon resonance measurement system for efficient urea biosensing using ZnO thin film matrix

    NASA Astrophysics Data System (ADS)

    Paliwal, Ayushi; Tomar, Monika; Gupta, Vinay

    2016-08-01

    The present report addresses the application of surface plasmon resonance (SPR) phenomenon for urea sensing. The former promises a high sensitivity, label-free detection, and real-time information by monitoring the refractive index change at the metal-dielectric interface. In the present report, a highly sensitive urea biosensor has been developed by integrating a ZnO thin film matrix with the SPR technique. Kretschmann configuration has been used to excite the surface plasmon (SP) modes at the ZnO-metal (gold) interface using an indigeneously developed table top SPR measurement setup. Urease (Urs), the urea-specific enzyme, has been immobilized on the surface of ZnO thin film by physical adsorption technique. The SPR reflectance curves were recorded for the prism/Au/ZnO/Urs system in angular interrogation mode with phosphate-buffered saline (PBS) solution as the liquid media. The SPR resonance angle is found to be shifted toward a lower angle from 49.1 to 42.0 deg with an increase in the urea concentration (0 to 300 mg/dl) in the PBS solution. The developed sensor (prism/Au/ZnO/Urs) is found to be highly sensitive [sensitivity=0.039 deg/(mg/dl) or 203 deg/RIU] with detection accuracy of 0.045deg.

  14. Optical and electrical properties of ZnO nanocrystal thin films passivated by atomic layer deposited Al2O3

    NASA Astrophysics Data System (ADS)

    Choi, Ji-Hyuk; Kim, Jungwoo; Oh, Soong Ju; Kim, Daekyoung; Kim, Yong-Hoon; Chae, Heeyeop; Kim, Hyoungsub

    2016-07-01

    While colloidal semiconductor nanocrystal (NC) is preferred for use in solution-based optoelectronic devices, the large number of surface defects associated with its high surface-to-volume ratio degrades the optimal performance of NC-based devices due to the extensive trapping of free carriers available for charge transport. Here, we studied a simple and effective strategy to control the degree of passivation and doping level of solution-deposited ZnO NC films by infilling with ultra-thin Al2O3 using an atomic layer deposition (ALD) technique. According to various spectroscopic, microstructural, and electrical analyses, the ALD-Al2O3 treatment dramatically reduced the number of surface trap states with high ambient stability while simultaneously supplied excess carriers probably via a remote doping mechanism. As a consequence, the field-effect transistors built using the ZnO NC films with ALD-Al2O3 treatment for an optimal number of cycles exhibited significantly enhanced charge transport.

  15. Structural, optical, and electrical properties of ZnO thin films deposited by sol-gel dip-coating process at low temperature

    NASA Astrophysics Data System (ADS)

    Kim, Soaram; Nam, Giwoong; Yoon, Hyunsik; Park, Hyunggil; Choi, Hyonkwang; Kim, Jong Su; Kim, Jin Soo; Kim, Do Yeob; Kim, Sung-O.; Leem, Jae-Young

    2014-07-01

    Sol-gel dip-coating was used to prepare ZnO thin films with relaxed residual stress by lowering the deposition temperature from room temperature (25°C) to -25°C. The effect of deposition temperature on the structural, optical, and electrical properties of the films was characterized using scanning electron microscopy (SEM), Raman spectroscopy, photoluminescence (PL), ultraviolet-visible (UV-Vis) spectroscopy and reflectance accessory, and the van der Pauw method. All the thin films were deposited successfully onto quartz substrates and exhibited fibrous root morphology. At low temperature, the deposition rate was higher than at room temperature (RT) because of enhanced viscosity of the films. Further, lowering the deposition temperature affected the structural, optical, and electrical properties of the ZnO thin films. The surface morphology, residual stress, PL properties, and optical transmittance and reflectance of the films were measured, and this information was used to determine the absorption coefficient, optical band gap, Urbach energy, refractive index, refractive index at infinite wavelength, extinction coefficient, single-oscillator energy, dispersion energy, average oscillator wavelength, moments M -1 and M -3, dielectric constant, optical conductivity, and electrical resistivity of the ZnO thin films.

  16. Assessment of structural, optical and conduction properties of ZnO thin films in the presence of acceptor impurities

    NASA Astrophysics Data System (ADS)

    Plugaru, R.; Plugaru, N.

    2016-06-01

    The structural, optical and electrical conduction properties of (Li/Cu,N):ZnO codoped thin films synthesized by the sol-gel method were investigated by field emission scanning electron microscopy (FESEM), x-ray diffraction (XRD), transmission and absorption, photoluminescence (PL) and I-V measurements in order to bring evidence of the formation of acceptor centers by dual-acceptor codoping processes. The (Li 3%,N 5%):ZnO films consist of crystallites with average size of 15 nm, show 95% transmission in the visible region, and an optical band gap of 3.22 eV. The PL spectra show emission maxima at 3.21 and 2.96 eV which are related to the emission of acceptor centers and the presence of defects, respectively. Li occupies interstitial sites and may form Lii-N(O) defect complexes that act as acceptor centers. The (Cu 3%,N 5%):ZnO films consist of crystallites with average size of 12 nm, and exhibit 90% transmission in the visible region. The PL spectra reveal band edge emission at 3.23 eV and defect related emission at 2.74 eV. In the (Cu,N) codoped films, copper substitutes zinc and adopts mainly the Cu1+ state. A possible defect complex involving Cu and N determines the transition from n- to p-type conductivity. These findings are in agreement with results of electronic structure calculations at the GGA-PBE level.

  17. On the sol pH and the structural, optical and electrical properties of ZnO thin films

    NASA Astrophysics Data System (ADS)

    Meziane, K.; El Hichou, A.; El Hamidi, A.; Mansori, M.; Liba, A.; Almaggoussi, A.

    2016-05-01

    Zinc oxide thin films were prepared by the sol-gel method and deposed on glass substrate using spin coating technique. The variation of the structural, optical and electrical properties with various pH values is investigated. pH values of the sol were adjusted with glacial acetic acid and ammonia. X-ray diffraction analysis showed that the films with alkaline sol are crystallized while those with acidic sol are amorphous. High values of texture coefficient and a high diffraction intensity of the (002) peak, ensuring better growth along c-axis, were obtained for an optimal pH value of 9.5. The crystallite size of the obtained films strongly depends on the sol pH. Scanning Electron Microscopy (SEM) images confirm that the morphology and grain size of the films are affected significantly by pH. The optical transmission was recorded to analyze the optical properties of the studied films. It was found that the optical gap increased with pH. The electrical properties were measured by Hall-effect and reveal an increase of the resistivity when the sol pH increases. A minimum residual intrinsic electrons density suitable for p-type ZnO was reached.

  18. Synthesis and characteristics of Mg doped ZnO thin films: Experimental and ab-initio study

    NASA Astrophysics Data System (ADS)

    Rouchdi, M.; Salmani, E.; Fares, B.; Hassanain, N.; Mzerd, A.

    Structural and physical properties of Mg doped zinc oxide (MZO) thin films have been investigated. The samples have been synthesized using a simple spray pyrolysis technique. The hexagonal Wurtzite structured ZnO thin films were confirmed by X-ray diffraction (XRD). The morphology of the thin films was characterized by atomic force microscopy (AFM). The optical properties were studied in details by using ultraviolet-visible (UV-Vis) spectrophotometry and Hall Effect measurements for electrical characteristic. The results detected by AFM indicate in a qualitative and quantitative manner how the surface properties (topography, roughness) vary with Mg concentration. The optical characterization showed that the transmittance of MZO thin films increased from 75 to about 90% and optical band gap energy from 3.20 to 3.43 (eV). The electrical properties study showed the lowest resistivity value was 3.45 × 10-2 (Ω·cm), which was obtained for the film doped with ZnO:Mg (2 at.%). In order to confirm our results on optical properties, the band structure of Wurtzite Zn1-xMgxO was calculated by ab initio calculations using the Korringa-Kohn-Rostoker (KKR) method combined with the coherent potential approximation (CPA).

  19. Epitaxial ZnO/LiNbO{sub 3}/ZnO stacked layer waveguide for application to thin-film Pockels sensors

    SciTech Connect

    Akazawa, Housei Fukuda, Hiroshi

    2015-05-15

    We produced slab waveguides consisting of a LiNbO{sub 3} (LN) core layer that was sandwiched with Al-doped ZnO cladding layers. The ZnO/LN/ZnO stacked layers were grown on sapphire C-planes by electron cyclotron resonance (ECR) plasma sputtering and were subjected to structural, electrical, and optical characterizations. X-ray diffraction confirmed that the ZnO and LN layers were epitaxial without containing misoriented crystallites. The presence of 60°-rotational variants of ZnO and LN crystalline domains were identified from X-ray pole figures. Cross-sectional transmission electron microscopy images revealed a c-axis orientated columnar texture for LN crystals, which ensured operation as electro-optic sensors based on optical anisotropy along longitudinal and transversal directions. The interfacial roughness between the LN core and ZnO bottom layers as well as that between the ZnO top and the LN core layers was less than 20 nm, which agreed with surface images observed with atomic force microscopy. Outgrowth of triangular LN crystalline domains produced large roughness at the LN film surface. The RMS roughness of the LN film surface was twice that of the same structure grown on sapphire A-planes. Vertical optical transmittance of the stacked films was higher than 85% within the visible and infrared wavelength range. Following the approach adopted by Teng and Man [Appl. Phys. Lett. 56, 1734 (1990)], ac Pockels coefficients of r{sub 33} = 24-28 pm/V were derived for c-axis oriented LN films grown on low-resistive Si substrates. Light propagation within a ZnO/LN/ZnO slab waveguide as well as within a ZnO single layer waveguide was confirmed. The birefringence of these waveguides was 0.11 for the former and 0.05 for the latter.

  20. Rapid lateral solidification of pure Cu and Au thin films encapsulated in SiO2

    NASA Astrophysics Data System (ADS)

    Kline, J. E.; Leonard, J. P.

    2005-05-01

    Excimer laser melting and lateral resolidification is demonstrated in 200nm thick Cu and Au elemental metal thin films encapsulated between SiO2 layers. Projection irradiation is used to selectively and completely melt lines 3to30μm wide in the metal film—with rapid lateral solidification originating from the unmelted sidewalls of the molten region—resulting in large columnar grains, extending transversely to the middle of the line. Transmission electron microscopy reveals twinning structures and other defects typical of rapid solidification. Encapsulation and control of the fluence are found to be crucial parameters necessary to prevent film dewetting while molten.