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Sample records for 90nm digital cmos

  1. Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node

    NASA Technical Reports Server (NTRS)

    Ladbury, Raymond L.; Gorelick, Jerry L.; Berg, M. D.; Kim, H.; LaBel, K.; Friendlich, M.; Koga, R.; George, J.; Crain, S.; Yu, P.; Reed, R. A.

    2006-01-01

    We present Single Event Effect (SEE) and Total Ionizing Dose (TID) data for 1 Gbit DDR SDRAMs (90 nm CMOS technology) as well as comparing this data with earlier technology nodes from the same manufacturer.

  2. IC design of low power, wide tuning range VCO in 90 nm CMOS technology

    NASA Astrophysics Data System (ADS)

    Zhu, Li; Zhigong, Wang; Zhiqun, Li; Qin, Li; Faen, Liu

    2014-12-01

    A low power VCO with a wide tuning range and low phase noise has been designed and realized in a standard 90 nm CMOS technology. A newly proposed current-reuse cross-connected pair is utilized as a negative conductance generator to compensate the energy loss of the resonator. The supply current is reduced by half compared to that of the conventional LC-VCO. An improved inversion-mode MOSFET (IMOS) varactor is introduced to extend the capacitance tuning range from 32.8% to 66%. A detailed analysis of the proposed varactor is provided. The VCO achieves a tuning range of 27-32.5 GHz, exhibiting a frequency tuning range (FTR) of 18.4% and a phase noise of -101.38 dBc/Hz at 1 MHz offset from a 30 GHz carrier, and shows an excellent FOM of -185 dBc/Hz. With the voltage supply of 1.5 V, the core circuit of VCO draws only 2.1 mA DC current.

  3. Low power, CMOS digital autocorrelator spectrometer for spaceborne applications

    NASA Technical Reports Server (NTRS)

    Chandra, Kumar; Wilson, William J.

    1992-01-01

    A 128-channel digital autocorrelator spectrometer using four 32 channel low power CMOS correlator chips was built and tested. The CMOS correlator chip uses a 2-bit multiplication algorithm and a full-custom CMOS VLSI design to achieve low DC power consumption. The digital autocorrelator spectrometer has a 20 MHz band width, and the total DC power requirement is 6 Watts.

  4. CMOS digital pixel sensors: technology and applications

    NASA Astrophysics Data System (ADS)

    Skorka, Orit; Joseph, Dileepan

    2014-04-01

    CMOS active pixel sensor technology, which is widely used these days for digital imaging, is based on analog pixels. Transition to digital pixel sensors can boost signal-to-noise ratios and enhance image quality, but can increase pixel area to dimensions that are impractical for the high-volume market of consumer electronic devices. There are two main approaches to digital pixel design. The first uses digitization methods that largely rely on photodetector properties and so are unique to imaging. The second is based on adaptation of a classical analog-to-digital converter (ADC) for in-pixel data conversion. Imaging systems for medical, industrial, and security applications are emerging lower-volume markets that can benefit from these in-pixel ADCs. With these applications, larger pixels are typically acceptable, and imaging may be done in invisible spectral bands.

  5. Design and implementation of a 1-V transformer magnetic feedback low-noise amplifier (LNA) at 5-6 GHz, in a 90 nm complementary metal-oxide-semiconductor (CMOS) process

    NASA Astrophysics Data System (ADS)

    Kytonaki, Eleni-Sotiria; Simitsakis, Paschalis; Bazigos, Antonios; Papananos, Yannis

    2011-02-01

    In this study, a low-noise amplifier (LNA) suitable for low-voltage operation is presented. The LNA operates at a frequency range between 5 and 6 GHz. Its topology exploits magnetic feedback to achieve high reverse isolation and low noise performance without a significant degradation of the gain and linearity of the circuit. The design has been fabricated, considering full electrostatic discharge protection, in a modern 90 nm complementary metal-oxide-semiconductor process. The measured performance, at 5.4 GHz, shows a reverse isolation of -17.3 dB, a gain of 10.4 dB, a noise figure of 0.98 dB and an input intercept point of 1.4 dBm. The circuit dissipates 12.5 mW from a 1 V supply, while it occupies 0.162 mm2 of the die area.

  6. Noise in a CMOS digital pixel sensor

    NASA Astrophysics Data System (ADS)

    Chi, Zhang; Suying, Yao; Jiangtao, Xu

    2011-11-01

    Based on the study of noise performance in CMOS digital pixel sensor (DPS), a mathematical model of noise is established with the pulse-width-modulation (PWM) principle. Compared with traditional CMOS image sensors, the integration time is different and A/D conversion is implemented in each PWM DPS pixel. Then, the quantitative calculating formula of system noise is derived. It is found that dark current shot noise is the dominant noise source in low light region while photodiode shot noise becomes significantly important in the bright region. In this model, photodiode shot noise does not vary with luminance, but dark current shot noise does. According to increasing photodiode capacitance and the comparator's reference voltage or optimizing the mismatch in the comparator, the total noise can be reduced. These results serve as a guideline for the design of PWM DPS.

  7. A low power 20 GHz comparator in 90 nm COMS technology

    NASA Astrophysics Data System (ADS)

    Kai, Tang; Qiao, Meng; Zhigong, Wang; Ting, Guo

    2014-05-01

    A low power 20 GHz CMOS dynamic latched regeneration comparator for ultra-high-speed, low-power analog-to-digital converters (ADCs) is proposed. The time constant in both the tracking and regeneration phases of the latch are analyzed based on the small signal model. A dynamic source-common logic (SCL) topology is adopted in the master-slave latch to increase the tracking and regeneration speeds. Implemented in 90 nm CMOS technology, this comparator only occupies a die area of 65 × 150 μm2 with a power dissipation of 14 mW from a 1.2 V power supply. The measurement results show that the comparator can work up to 20 GHz. Operating with an input frequency of 1 GHz, the circuit can oversample up to 20 Giga-sampling-per-second (GSps) with 5 bits resolution; while operating at Nyquist, the comparator can sample up to 20 GSps with 4 bits resolution. The comparator has been successfully used in a 20 GSps flash ADC and the circuit can be also used in other high speed applications.

  8. Fully CMOS analog and digital SiPMs

    NASA Astrophysics Data System (ADS)

    Zou, Yu; Villa, Federica; Bronzi, Danilo; Tisa, Simone; Tosi, Alberto; Zappa, Franco

    2015-03-01

    Silicon Photomultipliers (SiPMs) are emerging single photon detectors used in many applications requiring large active area, photon-number resolving capability and immunity to magnetic fields. We present three families of analog SiPM fabricated in a reliable and cost-effective fully standard planar CMOS technology with a total photosensitive area of 1×1 mm2. These three families have different active areas with fill-factors (21%, 58.3%, 73.7%) comparable to those of commercial SiPM, which are developed in vertical (current flow) custom technologies. The peak photon detection efficiency in the near-UV tops at 38% (fill-factor included) comparable to commercial custom-process ones and dark count rate density is just a little higher than the best-in-class commercial analog SiPMs. Thanks to the CMOS processing, these new SiPMs can be integrated together with active components and electronics both within the microcell and on-chip, in order to act at the microcell level or to perform global pre-processing. We also report CMOS digital SiPMs in the same standard CMOS technology, based on microcells with digitalized processing, all integrated on-chip. This CMOS digital SiPMs has four 32×1 cells (128 microcells), each consisting of SPAD, active quenching circuit with adjustable dead time, digital control (to switch off noisy SPADs and readout position of detected photons), and fast trigger output signal. The achieved 20% fill-factor is still very good.

  9. Cryogenic CMOS circuits for single charge digital readout.

    SciTech Connect

    Gurrieri, Thomas M.; Longoria, Erin Michelle; Eng, Kevin; Carroll, Malcolm S.; Hamlet, Jason R.; Young, Ralph Watson

    2010-03-01

    The readout of a solid state qubit often relies on single charge sensitive electrometry. However the combination of fast and accurate measurements is non trivial due to large RC time constants due to the electrometers resistance and shunt capacitance from wires between the cold stage and room temperature. Currently fast sensitive measurements are accomplished through rf reflectrometry. I will present an alternative single charge readout technique based on cryogenic CMOS circuits in hopes to improve speed, signal-to-noise, power consumption and simplicity in implementation. The readout circuit is based on a current comparator where changes in current from an electrometer will trigger a digital output. These circuits were fabricated using Sandia's 0.35 {micro}m CMOS foundry process. Initial measurements of comparators with an addition a current amplifier have displayed current sensitivities of < 1nA at 4.2K, switching speeds up to {approx}120ns, while consuming {approx}10 {micro}W. I will also discuss an investigation of noise characterization of our CMOS process in hopes to obtain a better understanding of the ultimate limit in signal to noise performance.

  10. Cryogenic CMOS circuits for single charge digital readout

    NASA Astrophysics Data System (ADS)

    Eng, Kevin; Gurrieri, T. M.; Hamlet, J.; Carroll, M. S.

    2010-03-01

    The readout of a solid state qubit often relies on single charge sensitive electrometry. However the combination of fast and accurate measurements is non trivial due to large RC time constants due to the electrometers resistance and shunt capacitance from wires between the cold stage and room temperature. Currently fast sensitive measurements are accomplished through rf reflectrometry. I will present an alternative single charge readout technique based on cryogenic CMOS circuits in hopes to improve speed, signal-to-noise, power consumption and simplicity in implementation. The readout circuit is based on a current comparator where changes in current from an electrometer will trigger a digital output. These circuits were fabricated using Sandia's 0.35μm CMOS foundry process. Initial measurements of comparators with an addition a current amplifier have displayed current sensitivities of < 1nA at 4.2K, switching speeds up to ˜120ns, while consuming ˜10μW. I will also discuss an investigation of noise characterization of our CMOS process in hopes to obtain a better understanding of the ultimate limit in signal to noise performance.

  11. All-Digital Time-Domain CMOS Smart Temperature Sensor with On-Chip Linearity Enhancement

    PubMed Central

    Chen, Chun-Chi; Chen, Chao-Lieh; Lin, Yi

    2016-01-01

    This paper proposes the first all-digital on-chip linearity enhancement technique for improving the accuracy of the time-domain complementary metal-oxide semiconductor (CMOS) smart temperature sensor. To facilitate on-chip application and intellectual property reuse, an all-digital time-domain smart temperature sensor was implemented using 90 nm Field Programmable Gate Arrays (FPGAs). Although the inverter-based temperature sensor has a smaller circuit area and lower complexity, two-point calibration must be used to achieve an acceptable inaccuracy. With the help of a calibration circuit, the influence of process variations was reduced greatly for one-point calibration support, reducing the test costs and time. However, the sensor response still exhibited a large curvature, which substantially affected the accuracy of the sensor. Thus, an on-chip linearity-enhanced circuit is proposed to linearize the curve and achieve a new linearity-enhanced output. The sensor was implemented on eight different Xilinx FPGA using 118 slices per sensor in each FPGA to demonstrate the benefits of the linearization. Compared with the unlinearized version, the maximal inaccuracy of the linearized version decreased from 5 °C to 2.5 °C after one-point calibration in a range of −20 °C to 100 °C. The sensor consumed 95 μW using 1 kSa/s. The proposed linearity enhancement technique significantly improves temperature sensing accuracy, avoiding costly curvature compensation while it is fully synthesizable for future Very Large Scale Integration (VLSI) system. PMID:26840316

  12. All-Digital Time-Domain CMOS Smart Temperature Sensor with On-Chip Linearity Enhancement.

    PubMed

    Chen, Chun-Chi; Chen, Chao-Lieh; Lin, Yi

    2016-01-01

    This paper proposes the first all-digital on-chip linearity enhancement technique for improving the accuracy of the time-domain complementary metal-oxide semiconductor (CMOS) smart temperature sensor. To facilitate on-chip application and intellectual property reuse, an all-digital time-domain smart temperature sensor was implemented using 90 nm Field Programmable Gate Arrays (FPGAs). Although the inverter-based temperature sensor has a smaller circuit area and lower complexity, two-point calibration must be used to achieve an acceptable inaccuracy. With the help of a calibration circuit, the influence of process variations was reduced greatly for one-point calibration support, reducing the test costs and time. However, the sensor response still exhibited a large curvature, which substantially affected the accuracy of the sensor. Thus, an on-chip linearity-enhanced circuit is proposed to linearize the curve and achieve a new linearity-enhanced output. The sensor was implemented on eight different Xilinx FPGA using 118 slices per sensor in each FPGA to demonstrate the benefits of the linearization. Compared with the unlinearized version, the maximal inaccuracy of the linearized version decreased from 5 °C to 2.5 °C after one-point calibration in a range of -20 °C to 100 °C. The sensor consumed 95 μW using 1 kSa/s. The proposed linearity enhancement technique significantly improves temperature sensing accuracy, avoiding costly curvature compensation while it is fully synthesizable for future Very Large Scale Integration (VLSI) system. PMID:26840316

  13. High-performance VGA-resolution digital color CMOS imager

    NASA Astrophysics Data System (ADS)

    Agwani, Suhail; Domer, Steve; Rubacha, Ray; Stanley, Scott

    1999-04-01

    This paper discusses the performance of a new VGA resolution color CMOS imager developed by Motorola on a 0.5micrometers /3.3V CMOS process. This fully integrated, high performance imager has on chip timing, control, and analog signal processing chain for digital imaging applications. The picture elements are based on 7.8micrometers active CMOS pixels that use pinned photodiodes for higher quantum efficiency and low noise performance. The image processing engine includes a bank of programmable gain amplifiers, line rate clamping for dark offset removal, real time auto white balancing, per column gain and offset calibration, and a 10 bit pipelined RSD analog to digital converter with a programmable input range. Post ADC signal processing includes features such as bad pixel replacement based on user defined thresholds levels, 10 to 8 bit companding and 5 tap FIR filtering. The sensor can be programmed via a standard I2C interface that runs on 3.3V clocks. Programmable features include variable frame rates using a constant frequency master clock, electronic exposure control, continuous or single frame capture, progressive or interlace scanning modes. Each pixel is individually addressable allowing region of interest imaging and image subsampling. The sensor operates with master clock frequencies of up to 13.5MHz resulting in 30FPS. A total programmable gain of 27dB is available. The sensor power dissipation is 400mW at full speed of operation. The low noise design yields a measured 'system on a chip' dynamic range of 50dB thus giving over 8 true bits of resolution. Extremely high conversion gain result in an excellent peak sensitivity of 22V/(mu) J/cm2 or 3.3V/lux-sec. This monolithic image capture and processing engine represent a compete imaging solution making it a true 'camera on a chip'. Yet in its operation it remains extremely easy to use requiring only one clock and a 3.3V power supply. Given the available features and performance levels, this sensor will be

  14. CMOS digital intra-oral sensor for x-ray radiography

    NASA Astrophysics Data System (ADS)

    Liu, Xinqiao; Byczko, Andrew; Choi, Marcus; Chung, Lap; Do, Hung; Fowler, Boyd; Ispasoiu, Radu; Joshi, Kumar; Miller, Todd; Nagy, Alex; Reaves, David; Rodricks, Brian; Teeter, Doug; Wang, George; Xiao, Feng

    2011-03-01

    In this paper, we present a CMOS digital intra-oral sensor for x-ray radiography. The sensor system consists of a custom CMOS imager, custom scintillator/fiber optics plate, camera timing and digital control electronics, and direct USB communication. The CMOS imager contains 1700 x 1346 pixels. The pixel size is 19.5um x 19.5um. The imager was fabricated with a 0.18um CMOS imaging process. The sensor and CMOS imager design features chamfered corners for patient comfort. All camera functions were integrated within the sensor housing and a standard USB cable was used to directly connect the intra-oral sensor to the host computer. The sensor demonstrated wide dynamic range from 5uGy to 1300uGy and high image quality with a SNR of greater than 160 at 400uGy dose. The sensor has a spatial resolution more than 20 lp/mm.

  15. Automatic Synthesis of CMOS Algorithmic Analog To-Digital Converter.

    NASA Astrophysics Data System (ADS)

    Jusuf, Gani

    The steady decrease in technological feature size is allowing increasing levels of integration in analog/digital interface functions. These functions consist of analog as well as digital circuits. While the turn around time for an all digital IC chip is very short due to the maturity of digital IC computer-aided design (CAD) tools over the last ten years, most analog circuits have to be designed manually due to the lack of analog IC CAD tools. As a result, analog circuit design becomes the bottleneck in the design of mixed signal processing chips. One common analog function in a mixed signal processing chip is an analog-to-digital conversion (ADC) function. This function recurs frequently but with varying performance requirements. The objective of this research is to study the design methodology of a compilation program capable of synthesizing ADC's with a broad range of sampling rates and resolution, and silicon area and performance comparable with the manual approach. The automatic compilation of the ADC function is a difficult problem mainly because ADC techniques span such a wide spectrum of performance, with radically different implementations being optimum for different ranges of conversion range, resolution, and power dissipation. We will show that a proper choice of the ADC architectures and the incorporation of many analog circuit design techniques will simplify the synthesis procedure tremendously. Moreover, in order to speed up the device sizing, hierarchical optimization procedure and behavioral simulation are implemented into the ADC module generation steps. As a result of this study, a new improved algorithmic ADC without the need of high precision comparators has been developed. This type of ADC lends itself to automatic generation due to its modularity, simplicity, small area consumption, moderate speed, low power dissipation, and single parameter trim capability that can be added at high resolution. Furthermore, a performance-driven CMOS ADC module

  16. Improved overlay metrology device correlation on 90-nm logic processes

    NASA Astrophysics Data System (ADS)

    Ueno, Atsushi; Tsujita, Kouichirou; Kurita, Hiroyuki; Iwata, Yasuhisa; Ghinovker, Mark; Poplawski, Jorge M.; Kassel, Elyakim; Adel, Mike E.

    2004-05-01

    Isolated and dense patterns were formed at process layers from gate through to back-end on wafers using a 90 nm logic device process utilizing ArF lithography under various lithography conditions. Pattern placement errors (PPE) between AIM grating and BiB marks were characterized for line widths varying from 1000nm to 140nm. As pattern size was reduced, overlay discrepancies became larger, a tendency which was confirmed by optical simulation with simple coma aberration. Furthermore, incorporating such small patterns into conventional marks resulted in significant degradation in metrology performance while performance on small pattern segmented grating marks was excellent. Finally, the data also show good correlation between the grating mark and specialized design rule feature SEM marks, with poorer correlation between conventional mark and SEM mark confirming that new grating mark significantly improves overlay metrology correlation with device patterns.

  17. A new CMOS-based digital imaging detector for applications in mammography

    NASA Astrophysics Data System (ADS)

    Baysal, Mehmet A.; Toker, Emre

    2005-09-01

    We have developed a CMOS-based x-ray imaging detector in the same form factor of a standard film cassette (18 cm × 24 cm) for Small Field-of-view Digital Mammography (SFDM) applications. This SFDM cassette is based on our three-side buttable, 25 mm × 50 mm, 48μm active-pixel CMOS sensor modules and utilizes a 150μm columnar CsI(Tl) scintillator. For imaging up to 100 mm × 100 mm field-of-view, a number of CMOS sensor modules need to be tiled and electronically synchronized together. By using fiber-optic communication, acquired images from the SFDM cassette can be transferred, processed and displayed on a review station within approximately 5 seconds of exposure, greatly enhancing patient flow. We present the physical performance of this CMOS-based SFDM cassette, using established objective criteria such as the Modulation Transfer Function (MTF), Detective Quantum Efficiency (DQE), and more subjective criteria, by evaluating images from a phantom study and the clinical studies of our collaborators. Driven by the strong demand from the computer industry, CMOS technology is one of the lowest cost, and the most readily accessible technologies available for digital mammography today. Recent popular use of CMOS imagers in high-end consumer cameras have also resulted in significant advances in the imaging performance of CMOS sensors against rivaling CCD sensors. The SFDM cassette can be employed in various mammography applications, including spot imaging, stereotactic biopsy imaging, core biopsy and surgical biopsy specimen radiography. This study demonstrates that all the image quality requirements for demanding mammography applications can be addressed with CMOS technology.

  18. Geiger-Mode Avalanche Photodiode Arrays Integrated to All-Digital CMOS Circuits

    PubMed Central

    Aull, Brian

    2016-01-01

    This article reviews MIT Lincoln Laboratory's work over the past 20 years to develop photon-sensitive image sensors based on arrays of silicon Geiger-mode avalanche photodiodes. Integration of these detectors to all-digital CMOS readout circuits enable exquisitely sensitive solid-state imagers for lidar, wavefront sensing, and passive imaging. PMID:27070609

  19. Geiger-Mode Avalanche Photodiode Arrays Integrated to All-Digital CMOS Circuits.

    PubMed

    Aull, Brian

    2016-01-01

    This article reviews MIT Lincoln Laboratory's work over the past 20 years to develop photon-sensitive image sensors based on arrays of silicon Geiger-mode avalanche photodiodes. Integration of these detectors to all-digital CMOS readout circuits enable exquisitely sensitive solid-state imagers for lidar, wavefront sensing, and passive imaging. PMID:27070609

  20. A 1 GHz sample rate, 256-channel, 1-bit quantization, CMOS, digital correlator chip

    NASA Technical Reports Server (NTRS)

    Timoc, C.; Tran, T.; Wongso, J.

    1992-01-01

    This paper describes the development of a digital correlator chip with the following features: 1 Giga-sample/second; 256 channels; 1-bit quantization; 32-bit counters providing up to 4 seconds integration time at 1 GHz; and very low power dissipation per channel. The improvements in the performance-to-cost ratio of the digital correlator chip are achieved with a combination of systolic architecture, novel pipelined differential logic circuits, and standard 1.0 micron CMOS process.

  1. Practicality of Evaluating Soft Errors in Commercial sub-90 nm CMOS for Space Applications

    NASA Technical Reports Server (NTRS)

    Pellish, Jonathan A.; LaBel, Kenneth A.

    2010-01-01

    The purpose of this presentation is to: Highlight space memory evaluation evolution, Review recent developments regarding low-energy proton direct ionization soft errors, Assess current space memory evaluation challenges, including increase of non-volatile technology choices, and Discuss related testing and evaluation complexities.

  2. Emulation of high-frequency substrate noise generation in CMOS digital circuits

    NASA Astrophysics Data System (ADS)

    Shimazaki, Shunsuke; Taga, Shota; Makita, Tetsuya; Azuma, Naoya; Miura, Noriyuki; Nagata, Makoto

    2014-01-01

    A noise emulator is based on the capacitor charging modeling and generates power and substrate noises expected in a CMOS digital integrated circuit. An off-chip near-magnetic-field sensor indirectly characterizes the distribution of clock timing and the adjustability of skews within on-chip digital circuits. An on-chip noise monitor captures power and substrate noise waveforms and evaluates noise frequency components in a wide frequency bandwidth. A 65 nm CMOS prototype demonstrated power and substrate noise generation in a variety of operating scenarios of digital integrated circuits. Power noise generation emulated at 125 MHz exhibits the enhancements of high-order harmonic components after deskewing at a timing resolution of 37.8 ps, as is specifically seen in more than 10 dB enlargement of the substrate noise component at 2.1 GHz.

  3. CMOS cassette for digital upgrade of film-based mammography systems

    NASA Astrophysics Data System (ADS)

    Baysal, Mehmet A.; Toker, Emre

    2006-03-01

    While full-field digital mammography (FFDM) technology is gaining clinical acceptance, the overwhelming majority (96%) of the installed base of mammography systems are conventional film-screen (FSM) systems. A high performance, and economical digital cassette based product to conveniently upgrade FSM systems to FFDM would accelerate the adoption of FFDM, and make the clinical and technical advantages of FFDM available to a larger population of women. The planned FFDM cassette is based on our commercial Digital Radiography (DR) cassette for 10 cm x 10 cm field-of-view spot imaging and specimen radiography, utilizing a 150 micron columnar CsI(Tl) scintillator and 48 micron active-pixel CMOS sensor modules. Unlike a Computer Radiography (CR) cassette, which requires an external digitizer, our DR cassette transfers acquired images to a display workstation within approximately 5 seconds of exposure, greatly enhancing patient flow. We will present the physical performance of our prototype system against other FFDM systems in clinical use today, using established objective criteria such as the Modulation Transfer Function (MTF), Detective Quantum Efficiency (DQE), and subjective criteria, such as a contrast-detail (CD-MAM) observer performance study. Driven by the strong demand from the computer industry, CMOS technology is one of the lowest cost, and the most readily accessible technologies available for FFDM today. Recent popular use of CMOS imagers in high-end consumer cameras have also resulted in significant advances in the imaging performance of CMOS sensors against rivaling CCD sensors. This study promises to take advantage of these unique features to develop the first CMOS based FFDM upgrade cassette.

  4. IR CMOS: near infrared enhanced digital imaging (Presentation Recording)

    NASA Astrophysics Data System (ADS)

    Pralle, Martin U.; Carey, James E.; Joy, Thomas; Vineis, Chris J.; Palsule, Chintamani

    2015-08-01

    SiOnyx has demonstrated imaging at light levels below 1 mLux (moonless starlight) at video frame rates with a 720P CMOS image sensor in a compact, low latency camera. Low light imaging is enabled by the combination of enhanced quantum efficiency in the near infrared together with state of the art low noise image sensor design. The quantum efficiency enhancements are achieved by applying Black Silicon, SiOnyx's proprietary ultrafast laser semiconductor processing technology. In the near infrared, silicon's native indirect bandgap results in low absorption coefficients and long absorption lengths. The Black Silicon nanostructured layer fundamentally disrupts this paradigm by enhancing the absorption of light within a thin pixel layer making 5 microns of silicon equivalent to over 300 microns of standard silicon. This results in a demonstrate 10 fold improvements in near infrared sensitivity over incumbent imaging technology while maintaining complete compatibility with standard CMOS image sensor process flows. Applications include surveillance, nightvision, and 1064nm laser see spot. Imaging performance metrics will be discussed. Demonstrated performance characteristics: Pixel size : 5.6 and 10 um Array size: 720P/1.3Mpix Frame rate: 60 Hz Read noise: 2 ele/pixel Spectral sensitivity: 400 to 1200 nm (with 10x QE at 1064nm) Daytime imaging: color (Bayer pattern) Nighttime imaging: moonless starlight conditions 1064nm laser imaging: daytime imaging out to 2Km

  5. A digitally calibrated CMOS RMS power detector for RF automatic gain control

    NASA Astrophysics Data System (ADS)

    Taotao, Yan; Hui, Wang; Jinbo, Li; Jianjun, Zhou

    2013-03-01

    This paper presents the design and implementation of a digitally calibrated CMOS wideband radio frequency (RF) root-mean-square (RMS) power detector for high accuracy RF automatic gain control (AGC). The proposed RMS power detector demonstrates accurate power detection in the presence of process, supply voltage, and temperature (PVT) variations by employing a digital calibration scheme. It also consumes low power and occupies a small chip area. The measurement results show that the scheme improves the accuracy of the detector to better than 0.3 dB over the PVT variations and wide operating frequency range from 0.2 to 0.8 GHz. Implemented in a 0.18 μm CMOS process and occupying a small die area of 263 × 214 μm2, the proposed digitally calibrated CMOS RMS power detector only consumes 1.6 mA in power detection mode and 2.1 mA in digital calibration mode from a 1.8 V supply voltage.

  6. Note: All-digital CMOS MOS-capacitor-based pulse-shrinking mechanism suitable for time-to-digital converters

    NASA Astrophysics Data System (ADS)

    Chen, Chun-Chi; Hwang, Chorng-Sii; Lin, You-Ting; Liu, Keng-Chih

    2015-12-01

    This paper presents an all-digital CMOS pulse-shrinking mechanism suitable for time-to-digital converters (TDCs). A simple MOS capacitor is used as a pulse-shrinking cell to perform time attenuation for time resolving. Compared with a previous pulse-shrinking mechanism, the proposed mechanism provides an appreciably improved temporal resolution with high linearity. Furthermore, the use of a binary-weighted pulse-shrinking unit with scaled MOS capacitors is proposed for achieving a programmable resolution. A TDC involving the proposed mechanism was fabricated using a TSMC (Taiwan Semiconductor Manufacturing Company) 0.18-μm CMOS process, and it has a small area of nearly 0.02 mm2 and an integral nonlinearity error of ±0.8 LSB for a resolution of 24 ps.

  7. Single event upset test structures for digital CMOS application specific integrated circuits

    SciTech Connect

    Baze, M.P.; Bartholet, W.G.; Braatz, J.C.; Dao, T.A. )

    1993-12-01

    An approach has been developed for the design and utilization of SEU test structures for digital CMOS ASICs. This approach minimizes the number of test structures required by categorizing ASIC library cells according to their SEU response and designing a structure to characterize each response for each category. Critical SEU response parameters extracted from these structures are used to evaluate the SEU hardness of ASIC libraries and predict the hardness of ASIC chips.

  8. Amorphous selenium direct detection CMOS digital x-ray imager with 25 micron pixel pitch

    NASA Astrophysics Data System (ADS)

    Scott, Christopher C.; Abbaszadeh, Shiva; Ghanbarzadeh, Sina; Allan, Gary; Farrier, Michael; Cunningham, Ian A.; Karim, Karim S.

    2014-03-01

    We have developed a high resolution amorphous selenium (a-Se) direct detection imager using a large-area compatible back-end fabrication process on top of a CMOS active pixel sensor having 25 micron pixel pitch. Integration of a-Se with CMOS technology requires overcoming CMOS/a-Se interfacial strain, which initiates nucleation of crystalline selenium and results in high detector dark currents. A CMOS-compatible polyimide buffer layer was used to planarize the backplane and provide a low stress and thermally stable surface for a-Se. The buffer layer inhibits crystallization and provides detector stability that is not only a performance factor but also critical for favorable long term cost-benefit considerations in the application of CMOS digital x-ray imagers in medical practice. The detector structure is comprised of a polyimide (PI) buffer layer, the a-Se layer, and a gold (Au) top electrode. The PI layer is applied by spin-coating and is patterned using dry etching to open the backplane bond pads for wire bonding. Thermal evaporation is used to deposit the a-Se and Au layers, and the detector is operated in hole collection mode (i.e. a positive bias on the Au top electrode). High resolution a-Se diagnostic systems typically use 70 to 100 μm pixel pitch and have a pre-sampling modulation transfer function (MTF) that is significantly limited by the pixel aperture. Our results confirm that, for a densely integrated 25 μm pixel pitch CMOS array, the MTF approaches the fundamental material limit, i.e. where the MTF begins to be limited by the a-Se material properties and not the pixel aperture. Preliminary images demonstrating high spatial resolution have been obtained from a frst prototype imager.

  9. Realization of the FPGA based TDI algorithm in digital domain for CMOS cameras

    NASA Astrophysics Data System (ADS)

    Tao, Shuping; Jin, Guang; Zhang, Xuyan; Qu, Hongsong

    2012-10-01

    In order to make the CMOS image sensors suitable for space high resolution imaging applications, a new method realizing TDI in digital domain by FPGA is proposed in this paper, which improves the imaging mode for area array CMOS sensors. The TDI algorithm accumulates the corresponding pixels of adjoining frames in digital domain, so the gray values increase by M times, where M is for the integration number, and the image's quality in signal-to-noise ratio can be improved. In addition, the TDI optimization algorithm is discussed. Firstly, the signal storage is optimized by 2 slices of external RAM, where memory depth expanding and the table tennis operation mechanism are used. Secondly, the FIFO operation mechanism reduces the reading and writing operation on memory by M×(M-1) times, It saves so much signal transfer time as is proportional to the square of integration number M2, that the frame frequency is able to increase greatly. At last, the CMOS camera based on TDI in digital domain is developed, and the algorithm is validated by experiments on it.

  10. A New Fully Differential CMOS Capacitance to Digital Converter for Lab-on-Chip Applications.

    PubMed

    Nabovati, Ghazal; Ghafar-Zadeh, Ebrahim; Mirzaei, Maryam; Ayala-Charca, Giancarlo; Awwad, Falah; Sawan, Mohamad

    2015-06-01

    In this paper, we present a new differential CMOS capacitive sensor for Lab-on-Chip applications. The proposed integrated sensor features a DC-input ΣΔ capacitance to digital converter (CDC) and two reference and sensing microelectrodes integrated on the top most metal layer in 0.35 μm CMOS process. Herein, we describe a readout circuitry with a programmable clocking strategy using a Charge Based Capacitance Measurement technique. The simulation and experimental results demonstrate a high capacitive dynamic range of 100 fF-110 fF, the sensitivity of 350 mV/fF and the minimum detectable capacitance variation of as low as 10 aF. We also demonstrate and discuss the use of this device for environmental applications through various chemical solvents. PMID:25134090

  11. Hybrid optically interconnected microprocessor: an InP I-MSM integrated onto a mixed-signal CMOS analog optical receiver with a digital CMOS microprocessor

    NASA Astrophysics Data System (ADS)

    Chang, Jae J.; Jung, Sungyong; Vrazel, Michael; Jung, Keeshik; Lee, Myunghee; Brooke, Martin A.; Jokerst, Nan Marie; Wills, Scott

    2000-05-01

    This paper presents the results of simultaneously working fully-differential optoelectronic receiver fabricated in Si CMOS with digital SIMD microprocessor on the same die next to analog, optical interface circuitry, the receiver have been hybrid integrated with a thin film InP-based inverted (I)-MSM photodetector and optically tested using external light source modulated by digital input signal. The noise immunity to mixed-signal digital switching noise of the differential receiver has been shown to be good enough to generate 10-9 BER.

  12. A CMOS image sensor with stacked photodiodes for lensless observation system of digital enzyme-linked immunosorbent assay

    NASA Astrophysics Data System (ADS)

    Takehara, Hironari; Miyazawa, Kazuya; Noda, Toshihiko; Sasagawa, Kiyotaka; Tokuda, Takashi; Kim, Soo Hyeon; Iino, Ryota; Noji, Hiroyuki; Ohta, Jun

    2014-01-01

    A CMOS image sensor with stacked photodiodes was fabricated using 0.18 µm mixed signal CMOS process technology. Two photodiodes were stacked at the same position of each pixel of the CMOS image sensor. The stacked photodiodes consist of shallow high-concentration N-type layer (N+), P-type well (PW), deep N-type well (DNW), and P-type substrate (P-sub). PW and P-sub were shorted to ground. By monitoring the voltage of N+ and DNW individually, we can observe two monochromatic colors simultaneously without using any color filters. The CMOS image sensor is suitable for fluorescence imaging, especially contact imaging such as a lensless observation system of digital enzyme-linked immunosorbent assay (ELISA). Since the fluorescence increases with time in digital ELISA, it is possible to observe fluorescence accurately by calculating the difference from the initial relation between the pixel values for both photodiodes.

  13. Low-noise CMOS SPAD arrays with in-pixel time-to-digital converters

    NASA Astrophysics Data System (ADS)

    Tosi, Alberto; Villa, Federica; Bronzi, Danilo; Zou, Yu; Lussana, Rudi; Tamborini, Davide; Tisa, Simone; Durini, Daniel; Weyers, Sascha; Pashen, Uwe; Brockherde, Werner; Zappa, Franco

    2014-05-01

    We present our latest results concerning CMOS Single-Photon Avalanche Diode (SPAD) arrays for high-throughput parallel single-photon counting. We exploited a high-voltage 0.35 μm CMOS technology in order to develop low-noise CMOS SPADs. The Dark Count Rate is 30 cps at room temperature for 30 μm devices, increases to 2 kcps for 100 μm SPADs and just to 100 kcps for 500 μm ones. Afterpulsing is less than 1% for hold-off time longer than 50 ns, thus allowing to reach high count rates. Photon Detection Efficiency is > 50% at 420 nm, > 40% below 500 nm and is still 5% at 850 nm. Timing jitter is less than 100 ps (FWHM) in SPADs with active area diameter up to 50 μm. We developed CMOS SPAD imagers with 150 μm pixel pitch and 30 μm SPADs. A 64×32 SPAD array is based on pixels including three 9-bit counters for smart phase-resolved photon counting up to 100 kfps. A 32x32 SPAD array includes 1024 10-bit Time-to-Digital Converters (TDC) with 300 ps resolution and 450 ps single-shot precision, for 3D ranging and FLIM. We developed also linear arrays with up to 60 pixels (with 100 μm SPAD, 150 μm pitch and in-pixel 250 ps TDC) for time-resolved parallel spectroscopy with high fill factor.

  14. CMOS-compatible InP/InGaAs digital photoreceiver

    DOEpatents

    Lovejoy, M.L.; Rose, B.H.; Craft, D.C.; Enquist, P.M.; Slater, D.B. Jr.

    1997-11-04

    A digital photoreceiver is formed monolithically on an InP semiconductor substrate and comprises a p-i-n photodetector formed from a plurality of InP/InGaAs layers deposited by an epitaxial growth process and an adjacent heterojunction bipolar transistor (HBT) amplifier formed from the same InP/InGaAs layers. The photoreceiver amplifier operates in a large-signal mode to convert a detected photocurrent signal into an amplified output capable of directly driving integrated circuits such as CMOS. In combination with an optical transmitter, the photoreceiver may be used to establish a short-range channel of digital optical communications between integrated circuits with applications to multi-chip modules (MCMs). The photoreceiver may also be used with fiber optic coupling for establishing longer-range digital communications (i.e. optical interconnects) between distributed computers or the like. Arrays of digital photoreceivers may be formed on a common substrate for establishing a plurality of channels of digital optical communication, with each photoreceiver being spaced by less than about 1 mm and consuming less than about 20 mW of power, and preferably less than about 10 mW. Such photoreceiver arrays are useful for transferring huge amounts of digital data between integrated circuits at bit rates of up to about 1,000 Mb/s or more. 4 figs.

  15. CMOS-compatible InP/InGaAs digital photoreceiver

    DOEpatents

    Lovejoy, Michael L.; Rose, Benny H.; Craft, David C.; Enquist, Paul M.; Slater, Jr., David B.

    1997-01-01

    A digital photoreceiver is formed monolithically on an InP semiconductor substrate and comprises a p-i-n photodetector formed from a plurality of InP/InGaAs layers deposited by an epitaxial growth process and an adjacent heterojunction bipolar transistor (HBT) amplifier formed from the same InP/InGaAs layers. The photoreceiver amplifier operates in a large-signal mode to convert a detected photocurrent signal into an amplified output capable of directly driving integrated circuits such as CMOS. In combination with an optical transmitter, the photoreceiver may be used to establish a short-range channel of digital optical communications between integrated circuits with applications to multi-chip modules (MCMs). The photoreceiver may also be used with fiber optic coupling for establishing longer-range digital communications (i.e. optical interconnects) between distributed computers or the like. Arrays of digital photoreceivers may be formed on a common substrate for establishing a plurality of channels of digital optical communication, with each photoreceiver being spaced by less than about 1 mm and consuming less than about 20 mW of power, and preferably less than about 10 mW. Such photoreceiver arrays are useful for transferring huge amounts of digital data between integrated circuits at bit rates of up to about 1000 Mb/s or more.

  16. 12-inch-wafer-scale CMOS active-pixel sensor for digital mammography

    NASA Astrophysics Data System (ADS)

    Heo, Sung Kyn; Kosonen, Jari; Hwang, Sung Ha; Kim, Tae Woo; Yun, Seungman; Kim, Ho Kyung

    2011-03-01

    This paper describes the development of an active-pixel sensor (APS) panel, which has a field-of-view of 23.1×17.1 cm and features 70-μm-sized pixels arranged in a 3300×2442 array format, for digital mammographic applications. The APS panel was realized on 12-inch wafers based on the standard complementary metal-oxide-semiconductor (CMOS) technology without physical tiling processes of several small-area sensor arrays. Electrical performance of the developed panel is described in terms of dark current, full-well capacity and leakage current map. For mammographic imaging, the optimized CsI:Tl scintillator is experimentally determined by being combined with the developed panel and analyzing im aging characteristics, such as modulation-transfer function, noise-power spectrum, detective quantum efficiency, image l ag, and contrast-detail analysis by using the CDMAM 3.4 phantom. With these results, we suggest that the developed CMOS-based detector can be used for conventional and advanced digital mammographic applications.

  17. A time-domain CMOS oscillator-based thermostat with digital set-point programming.

    PubMed

    Chen, Chun-Chi; Lin, Shih-Hao

    2013-01-01

    This paper presents a time-domain CMOS oscillator-based thermostat with digital set-point programming [without a digital-to-analog converter (DAC) or external resistor] to achieve on-chip thermal management of modern VLSI systems. A time-domain delay-line-based thermostat with multiplexers (MUXs) was used to substantially reduce the power consumption and chip size, and can benefit from the performance enhancement due to the scaling down of fabrication processes. For further cost reduction and accuracy enhancement, this paper proposes a thermostat using two oscillators that are suitable for time-domain curvature compensation instead of longer linear delay lines. The final time comparison was achieved using a time comparator with a built-in custom hysteresis to generate the corresponding temperature alarm and control. The chip size of the circuit was reduced to 0.12 mm2 in a 0.35-mm TSMC CMOS process. The thermostat operates from 0 to 90 °C, and achieved a fine resolution better than 0.05 °C and an improved inaccuracy of ± 0.6 °C after two-point calibration for eight packaged chips. The power consumption was 30 µW at a sample rate of 10 samples/s. PMID:23385403

  18. Development of CMOS Pixel Sensors with digital pixel dedicated to future particle physics experiments

    NASA Astrophysics Data System (ADS)

    Zhao, W.; Wang, T.; Pham, H.; Hu-Guo, C.; Dorokhov, A.; Hu, Y.

    2014-02-01

    Two prototypes of CMOS pixel sensor with in-pixel analog to digital conversion have been developed in a 0.18 μm CIS process. The first design integrates a discriminator into each pixel within an area of 22 × 33 μm2 in order to meet the requirements of the ALICE inner tracking system (ALICE-ITS) upgrade. The second design features 3-bit charge encoding inside a 35 × 35 μm2 pixel which is motivated by the specifications of the outer layers of the ILD vertex detector (ILD-VXD). This work aims to validate the concept of in-pixel digitization which offers higher readout speed, lower power consumption and less dead zone compared with the column-level charge encoding.

  19. Multiplexed Oversampling Digitizer in 65 nm CMOS for Column-Parallel CCD Readout

    SciTech Connect

    Grace, Carl; Walder, Jean-Pierre; von der Lippe, Henrik

    2012-04-10

    A digitizer designed to read out column-parallel charge-coupled devices (CCDs) used for high-speed X-ray imaging is presented. The digitizer is included as part of the High-Speed Image Preprocessor with Oversampling (HIPPO) integrated circuit. The digitizer module comprises a multiplexed, oversampling, 12-bit, 80 MS/s pipelined Analog-to-Digital Converter (ADC) and a bank of four fast-settling sample-and-hold amplifiers to instrument four analog channels. The ADC multiplexes and oversamples to reduce its area to allow integration that is pitch-matched to the columns of the CCD. Novel design techniques are used to enable oversampling and multiplexing with a reduced power penalty. The ADC exhibits 188 ?V-rms noise which is less than 1 LSB at a 12-bit level. The prototype is implemented in a commercially available 65 nm CMOS process. The digitizer will lead to a proof-of-principle 2D 10 Gigapixel/s X-ray detector.

  20. Digital Switching CMOS Power Amplifier for Multiband and Multimode Handset Applications

    NASA Astrophysics Data System (ADS)

    Nakatani, Toshifumi

    This thesis is directed towards the development of a digitally-assisted radio frequency power amplifier (RF PA) which is one of the potential solutions to realize a multiband and multimode transmitter with high efficiency for handset applications. To improve efficiency and linearity in multiple conditions, PA circuits and digital signal processing (DSP) algorithms are co-designed. In the dissertation, a proposed architecture employs a current-mode class-D (CMCD) configuration for high efficiency, and a polar modulation scheme driven by digital inputs. Detail design, fabrication and experimental results are given for circuit implementation and DSP of this architecture. First, a multiband watt-class complementary metal-oxide-semiconductor (CMOS) PA is demonstrated using 0.15 um CMOS integrated circuits (ICs), off-chip inductor and balun. To obtain high breakdown voltage, stacked field effect transistors (FETs) are used. The CMCD PA is tuned by band-switching capacitors, operating in the 0.7-1.8 GHz frequency band. The overall efficiencies of 27.1 / 25.6 % are achieved at 30.2 / 28.9 dBm CW output powers and 0.85 / 1.75 GHz carrier frequencies, respectively. Next, to achieve wide output power dynamic range, an architecture consisting of small segmented unti-cells is introduced into the PA, where multiple three-state unit-cells are used and the state of each unit-cell is controlled to provide a specific output power. The overall dynamic ranges are expanded to approximately 90 dB and 85 dB at and 0.85 / 1.75 GHz, respectively. The dissertation then presents digital modulation algorithms. The digital compensation techniques are developed to maintain linearity of an envelope modulator of the polar transmitter. A new digital pulse width modulation algorithm is also shown to partially suppress spurious signals associated with the digital input envelope signal. When wideband code-division multiple access (WCDMA) modulation is implemented, spur suppression of 9-10 dB is

  1. A Single-Chip 8-Band CMOS Transceiver for 3G Cellular Systems with Digital Interface

    NASA Astrophysics Data System (ADS)

    Yoshida, Hiroshi; Toyoda, Takehiko; Tsurumi, Hiroshi; Itoh, Nobuyuki

    In this paper, a single-chip dual-mode 8-band 130nm CMOS transceiver including A/D/A converters and digital filters with 312MHz LVDS interface is presented. For a transmitter chain, linear direct quadrature modulation architecture is introduced for both W-CDMA/HSDPA (High Speed Uplink Packet Access) and for GSM/EDGE. Analog baseband LPFs and quadrature modulators are commonly used both for GSM and for EDGE. For a direct conversion receiver chain, ABB (Analog Base-Band) blocks, i.e., LPFs and VGAs, delta-sigma A/D converters, and FIR filters are commonly used for W-CDMA/HSDPA (High Speed Downlink Packet Access) and GSM/EDGE to reduce chip area. Their characteristics can be reconfigured by register-based control sequence. The receiver chain also includes high-speed DC offset cancellers both in analog and in digital stage, and the self-contained AGC controller, whose parameters such as time constant are programmable to be free from DBB (Digital Base-Band) control. The transceiver also includes wide-range VCOs and fractional PLLs, an LVDS driver and receiver for high-speed digital interface of 312MHz. Measured results reveal that the transceiver satisfies 3GPP specifications for W-CDMA/HSPA (High Speed Packet Access) and GSM/EDGE.

  2. CMOS image sensor noise reduction method for image signal processor in digital cameras and camera phones

    NASA Astrophysics Data System (ADS)

    Yoo, Youngjin; Lee, SeongDeok; Choe, Wonhee; Kim, Chang-Yong

    2007-02-01

    Digital images captured from CMOS image sensors suffer Gaussian noise and impulsive noise. To efficiently reduce the noise in Image Signal Processor (ISP), we analyze noise feature for imaging pipeline of ISP where noise reduction algorithm is performed. The Gaussian noise reduction and impulsive noise reduction method are proposed for proper ISP implementation in Bayer domain. The proposed method takes advantage of the analyzed noise feature to calculate noise reduction filter coefficients. Thus, noise is adaptively reduced according to the scene environment. Since noise is amplified and characteristic of noise varies while the image sensor signal undergoes several image processing steps, it is better to remove noise in earlier stage on imaging pipeline of ISP. Thus, noise reduction is carried out in Bayer domain on imaging pipeline of ISP. The method is tested on imaging pipeline of ISP and images captured from Samsung 2M CMOS image sensor test module. The experimental results show that the proposed method removes noise while effectively preserves edges.

  3. Integrated High Resolution Digital Color Light Sensor in 130 nm CMOS Technology

    PubMed Central

    Strle, Drago; Nahtigal, Uroš; Batistell, Graciele; Zhang, Vincent Chi; Ofner, Erwin; Fant, Andrea; Sturm, Johannes

    2015-01-01

    This article presents a color light detection system integrated in 130 nm CMOS technology. The sensors and corresponding electronics detect light in a CIE XYZ color luminosity space using on-chip integrated sensors without any additional process steps, high-resolution analog-to-digital converter, and dedicated DSP algorithm. The sensor consists of a set of laterally arranged integrated photodiodes that are partly covered by metal, where color separation between the photodiodes is achieved by lateral carrier diffusion together with wavelength-dependent absorption. A high resolution, hybrid, ∑∆ ADC converts each photo diode’s current into a 22-bit digital result, canceling the dark current of the photo diodes. The digital results are further processed by the DSP, which calculates normalized XYZ or RGB color and intensity parameters using linear transformations of the three photo diode responses by multiplication of the data with a transformation matrix, where the coefficients are extracted by training in combination with a pseudo-inverse operation and the least-mean square approximation. The sensor system detects the color light parameters with 22-bit accuracy, consumes less than 60 μA on average at 10 readings per second, and occupies approx. 0.8 mm2 of silicon area (including three photodiodes and the analog part of the ADC). The DSP is currently implemented on FPGA. PMID:26205275

  4. CMOS self-powered monolithic light-direction sensor with digitalized output.

    PubMed

    Wang, Hongyi; Luo, Tao; Lu, Zhijian; Song, Hongjiang; Christen, Jennifer Blain

    2014-05-01

    We present a novel self-powered chip to detect the direction of incident light. This chip directly provides digitized output without the need of any off-chip power supply or optical or mechanical components. The chip was implemented in a standard 0.5 μm CMOS process. A microscale metal baffle was created by stacking all metal layers, contacts, and vias available in the process to produce on-chip shadowing. N-well/p+ photodiode arrays are located on both sides of the baffle to sense light. The photocurrent generated by a photodiode depends on the size of the photodiode and the shadowing. The shadowed area depends on the incident angle of the light. A current mirror circuit is used to compare the currents generated by the photodiodes on the opposite sides of the baffle and, consequently, provide a digital signal to indicate the incident light angle. Compared with the ideal linear digital light-angle detector with the same resolution, the presented sensor achieved the maximum error of only 2 deg over 110 deg test range. PMID:24784060

  5. A BiCMOS time interval digitizer based on fully-differential, current-steering circuits

    SciTech Connect

    Loinaz, M.J.; Wooley, B.A. . Center for Integrated Systems)

    1994-06-01

    A time interval digitizer cell with a 0--16 ns input range and a nominal LSB width of 1.0 ns has been integrated in a 2-[mu]m BiCMOS technology. The circuit exhibits both integral and differential nonlinearity below 0.15 LSB and a timing error of 0.32 ns RMS. Logic gate propagation delays are used as time measurement units, and the nominal value of the delays is set by an on-chip phase-locked loop (PLL). Fully-differential, current-steering circuits with low voltage swings are used to implement the time interval digitizer so as to generate minimal switching noise. The cell is to be used in the monolithic, multi-channel realization of a high-sensitivity, mixed-signal data acquisition front-end. By virtue of the time digitization architecture used, the average power dissipation of the cell is only 19.8 mW, despite the use of circuits that dissipate static power, and the layout area is a compact 448 [mu]m x 634 [mu]m.

  6. Integrated High Resolution Digital Color Light Sensor in 130 nm CMOS Technology.

    PubMed

    Strle, Drago; Nahtigal, Uroš; Batistell, Graciele; Zhang, Vincent Chi; Ofner, Erwin; Fant, Andrea; Sturm, Johannes

    2015-01-01

    This article presents a color light detection system integrated in 130 nm CMOS technology. The sensors and corresponding electronics detect light in a CIE XYZ color luminosity space using on-chip integrated sensors without any additional process steps, high-resolution analog-to-digital converter, and dedicated DSP algorithm. The sensor consists of a set of laterally arranged integrated photodiodes that are partly covered by metal, where color separation between the photodiodes is achieved by lateral carrier diffusion together with wavelength-dependent absorption. A high resolution, hybrid, ∑∆ ADC converts each photo diode's current into a 22-bit digital result, canceling the dark current of the photo diodes. The digital results are further processed by the DSP, which calculates normalized XYZ or RGB color and intensity parameters using linear transformations of the three photo diode responses by multiplication of the data with a transformation matrix, where the coefficients are extracted by training in combination with a pseudo-inverse operation and the least-mean square approximation. The sensor system detects the color light parameters with 22-bit accuracy, consumes less than 60 μA on average at 10 readings per second, and occupies approx. 0.8 mm(2) of silicon area (including three photodiodes and the analog part of the ADC). The DSP is currently implemented on FPGA. PMID:26205275

  7. Modeling and Experimental Demonstration of a Hopfield Network Analog-to-Digital Converter with Hybrid CMOS/Memristor Circuits.

    PubMed

    Guo, Xinjie; Merrikh-Bayat, Farnood; Gao, Ligang; Hoskins, Brian D; Alibart, Fabien; Linares-Barranco, Bernabe; Theogarajan, Luke; Teuscher, Christof; Strukov, Dmitri B

    2015-01-01

    The purpose of this work was to demonstrate the feasibility of building recurrent artificial neural networks with hybrid complementary metal oxide semiconductor (CMOS)/memristor circuits. To do so, we modeled a Hopfield network implementing an analog-to-digital converter (ADC) with up to 8 bits of precision. Major shortcomings affecting the ADC's precision, such as the non-ideal behavior of CMOS circuitry and the specific limitations of memristors, were investigated and an effective solution was proposed, capitalizing on the in-field programmability of memristors. The theoretical work was validated experimentally by demonstrating the successful operation of a 4-bit ADC circuit implemented with discrete Pt/TiO2- x /Pt memristors and CMOS integrated circuit components. PMID:26732664

  8. Modeling and Experimental Demonstration of a Hopfield Network Analog-to-Digital Converter with Hybrid CMOS/Memristor Circuits

    PubMed Central

    Guo, Xinjie; Merrikh-Bayat, Farnood; Gao, Ligang; Hoskins, Brian D.; Alibart, Fabien; Linares-Barranco, Bernabe; Theogarajan, Luke; Teuscher, Christof; Strukov, Dmitri B.

    2015-01-01

    The purpose of this work was to demonstrate the feasibility of building recurrent artificial neural networks with hybrid complementary metal oxide semiconductor (CMOS)/memristor circuits. To do so, we modeled a Hopfield network implementing an analog-to-digital converter (ADC) with up to 8 bits of precision. Major shortcomings affecting the ADC's precision, such as the non-ideal behavior of CMOS circuitry and the specific limitations of memristors, were investigated and an effective solution was proposed, capitalizing on the in-field programmability of memristors. The theoretical work was validated experimentally by demonstrating the successful operation of a 4-bit ADC circuit implemented with discrete Pt/TiO2−x/Pt memristors and CMOS integrated circuit components. PMID:26732664

  9. A time digitizer CMOS gate-array with a 250 ps time resolution

    SciTech Connect

    Arai, Yasuo

    1996-02-01

    Recent high-energy physics experiments are demanding a pipeline (deadtime-less) time-to-digital converter (TDC) with a time resolution of better than 500 ps and a double-pulse resolution of less than 30 ns. The TDC must keep all of the timing history until a trigger signal arrives about 3 {micro}s later. In large experiments, since the number of channels used is more than 100 k, the device must have a low power dissipation, a high circuit density and a low cost. A pipelined time digitizer CMOS gate-array has been developed using 0.5 {micro}m Sea-of-Gate technology. Precise timing signals which are used to sample input signals are generated from 32 taps of an asymmetric ring oscillator. The frequency of the oscillator is controlled by a phase-locked loop (PLL) circuit which runs in the 10--50 MHz frequency range. A test chip has been developed and tested; a time resolution of 250 ps rms at 40 MHz clock was measured. The chip has 4 channels and encoding circuits for both the rising and the falling edges of the input signals. The chip has 128-word dual-port memories, allowing the histories of the input signals to be stored and causing no deadtime for the conversion.

  10. Design and image-quality performance of high resolution CMOS-based X-ray imaging detectors for digital mammography

    NASA Astrophysics Data System (ADS)

    Cha, B. K.; Kim, J. Y.; Kim, Y. J.; Yun, S.; Cho, G.; Kim, H. K.; Seo, C.-W.; Jeon, S.; Huh, Y.

    2012-04-01

    In digital X-ray imaging systems, X-ray imaging detectors based on scintillating screens with electronic devices such as charge-coupled devices (CCDs), thin-film transistors (TFT), complementary metal oxide semiconductor (CMOS) flat panel imagers have been introduced for general radiography, dental, mammography and non-destructive testing (NDT) applications. Recently, a large-area CMOS active-pixel sensor (APS) in combination with scintillation films has been widely used in a variety of digital X-ray imaging applications. We employed a scintillator-based CMOS APS image sensor for high-resolution mammography. In this work, both powder-type Gd2O2S:Tb and a columnar structured CsI:Tl scintillation screens with various thicknesses were fabricated and used as materials to convert X-ray into visible light. These scintillating screens were directly coupled to a CMOS flat panel imager with a 25 × 50 mm2 active area and a 48 μm pixel pitch for high spatial resolution acquisition. We used a W/Al mammographic X-ray source with a 30 kVp energy condition. The imaging characterization of the X-ray detector was measured and analyzed in terms of linearity in incident X-ray dose, modulation transfer function (MTF), noise-power spectrum (NPS) and detective quantum efficiency (DQE).

  11. Achieving CDU requirement for 90-nm technology node and beyond with advanced mask making process technology

    NASA Astrophysics Data System (ADS)

    Tzu, San-De; Chang, Chung-Hsing; Chen, Wen-Chi; Kliem, Karl-Heinz; Hudek, Peter; Beyer, Dirk

    2005-01-01

    For 90nm node and beyond technology generations, one of the most critical challenges is how to meet the local CD uniformity (proximity) and global CD uniformity (GCDU) requirements within the exposure field. Both of them must be well controlled in the mask making process: (1) proximity effect and, (2) exposure pattern loading effect, or the so-called e-beam "fogging effect". In this paper, we report a method to improve our global CDU by means of a long range fogging compensation together with the Leica SB350 MW. This exposure tool is operated at 50keV and 1nm design grid. The proximity correction is done by the software - package "PROXECCO" from PDF Solutions. We have developed a unique correction method to reduce the fogging effect in dependency of the pattern density of the mask. This allows us to meet our customers" CDU specifications for the 90nm node and beyond.

  12. Characterization of a three side abuttable CMOS pixel sensor with digital pixel and data compression for charged particle tracking

    NASA Astrophysics Data System (ADS)

    Guilloux, F.; Değerli, Y.; Flouzat, C.; Lachkar, M.; Monmarthe, E.; Orsini, F.; Venault, P.

    2016-02-01

    CMOS monolithic pixel sensor technology has been chosen to equip the new ALICE trackers for HL-LHC . PIXAM is the final prototype from an R&D program specific to the Muon Forward Tracker which intends to push significantly forward the performances of the mature rolling shutter architecture. By implementing a digital pixel allowing to readout of a group of rows in parallel, the PIXAM sensor increases the rolling shutter readout speed while keeping the same power consumption as that of analogue pixel sensors. This paper will describe shortly the ASIC architecture and will focus on the analogue and digital performances of the sensor, obtained from laboratory measurements.

  13. A CMOS analog-digital integrated circuit for charged particle spectrum measurements

    SciTech Connect

    Paschalidis, N.P. Johns Hopkins Univ., Laurel, MD . Applied Physics); Sarris, E.T. ); Andreou, A.G. . Dept. of Electrical and Computer Engineering)

    1993-08-01

    The authors present a first prototype for a CMOS analog-digital integrated circuit suitable for energy spectra measurements of space plasmas, using solid state detectors. The single chip system includes a charge preamplifier followed by a pulse shaper, an energy discrimination block and an accumulation stage. The particle energy spectrum is measured in 10 channels through a novel non-linear flash A/D converter and is stored in equinumber 11-bit registers, which can then be selectively addressed, read out, and reset. The overall noise performance with detector capacitance of 50 pf is equivalent to [approximately] 7,000 electrons. The power dissipation is [approximately] 120 mW. The complete system can resolve particle counting rates as high as 1.5 [times] 10[sup 5] counts/sec, and as high as 10[sup 6] counts/sec in the pulse height analysis accumulation mode. The small size and low power dissipation makes such an application attractive for space experiments and portable nuclear instrumentation.

  14. FPGA chip performance improvement with gate shrink through alternating PSM 90nm process

    NASA Astrophysics Data System (ADS)

    Yu, Chun-Chi; Shieh, Ming-Feng; Liu, Erick; Lin, Benjamin; Ho, Jonathan; Wu, Xin; Panaite, Petrisor; Chacko, Manoj; Zhang, Yunqiang; Lei, Wen-Kang

    2005-11-01

    In the post-physical verification space called 'Mask Synthesis' a key component of design-for-manufacturing (DFM), double-exposure based, dark-field, alternating PSM (Alt-PSM) is being increasingly applied at the 90nm node in addition with other mature resolution enhancement techniques (RETs) such as optical proximity correction (OPC) and sub-resolution assist features (SRAF). Several high-performance IC manufacturers already use alt-PSM technology in 65nm production. At 90nm having strong control over the lithography process is a critical component in meeting targeted yield goals. However, implementing alt-PSM in production has been challenging due to several factors such as phase conflict errors, mask manufacturing, and the increased production cost due to the need for two masks in the process. Implementation of Alt-PSM generally requires phase compliance rules and proper phase topology in the layout and this has been successful for the technology node with these rules implemented. However, this may not be true for a mature, production process technology, in this case 90 nm. Especially, in the foundry-fabless business model where the foundry provides a standard set of design rules to its customers for a given process technology, and where not all the foundry customers require Alt-PSM in their tapeout flow. With minimum design changes, design houses usually are motivated by higher product performance for the existing designs. What follows is an in-depth review of the motivation to apply alt-PSM on a production FPGA, the DFM challenges to each partner faced, its effect on the tapeout flow, and how design, manufacturing, and EDA teams worked together to resolve phase conflicts, tapeout the chip, and finally verify the silicon results in production.

  15. Resolution of 90 nm (lambda/5) in an optical transmission microscope with an annular condenser.

    PubMed

    Vainrub, Arnold; Pustovyy, Oleg; Vodyanoy, Vitaly

    2006-10-01

    Resolution of 90 nm was achieved with a research microscope simply by replacing the standard bright-field condenser with a homebuilt illumination system with a cardioid annular condenser. Diffraction gratings with 100 nm width lines as well as less than 100 nm size features of different-shaped objects were clearly visible on a calibrated microscope test slide. The resolution increase results from a known narrower diffraction pattern in coherent illumination for the annular aperture compared with the circular aperture. This explanation is supported by an excellent accord of calculated and measured diffraction patterns for a 50 nm radius disk. PMID:16969401

  16. Resolution of 90 nm (λ/5) in an optical transmission microscope with an annular condenser

    NASA Astrophysics Data System (ADS)

    Vainrub, Arnold; Pustovyy, Oleg; Vodyanoy, Vitaly

    2006-10-01

    Resolution of 90 nm was achieved with a research microscope simply by replacing the standard bright-field condenser with a homebuilt illumination system with a cardioid annular condenser. Diffraction gratings with 100 nm width lines as well as less than 100 nm size features of different-shaped objects were clearly visible on a calibrated microscope test slide. The resolution increase results from a known narrower diffraction pattern in coherent illumination for the annular aperture compared with the circular aperture. This explanation is supported by an excellent accord of calculated and measured diffraction patterns for a 50 nm radius disk.

  17. Micropower CMOS Integrated Low-Noise Amplification, Filtering, and Digitization of Multimodal Neuropotentials

    PubMed Central

    Mollazadeh, Mohsen; Murari, Kartikeya; Cauwenberghs, Gert; Thakor, Nitish

    2009-01-01

    Electrical activity in the brain spans a wide range of spatial and temporal scales, requiring simultaneous recording of multiple modalities of neurophysiological signals in order to capture various aspects of brain state dynamics. Here, we present a 16-channel neural interface integrated circuit fabricated in a 0.5 μm 3M2P CMOS process for selective digital acquisition of biopotentials across the spectrum of neural signal modalities in the brain, ranging from single spike action potentials to local field potentials (LFP), electrocorticograms (ECoG), and electroencephalograms (EEG). Each channel is composed of a tunable bandwidth, fixed gain front-end amplifier and a programmable gain/resolution continuous-time incremental ΔΣ analog-to-digital converter (ADC). A two-stage topology for the front-end voltage amplifier with capacitive feedback offers independent tuning of the amplifier bandpass frequency corners, and attains a noise efficiency factor (NEF) of 2.9 at 8.2 kHz bandwidth for spike recording, and a NEF of 3.2 at 140 Hz bandwidth for EEG recording. The amplifier has a measured midband gain of 39.6 dB, frequency response from 0.2 Hz to 8.2 kHz, and an input-referred noise of 1.94 μVrms while drawing 12.2 μA of current from a 3.3 V supply. The lower and higher cutoff frequencies of the bandpass filter are adjustable from 0.2 to 94 Hz and 140 Hz to 8.2 kHz, respectively. At 10-bit resolution, the ADC has an SNDR of 56 dB while consuming 76 μW power. Time-modulation feedback in the ADC offers programmable digital gain (1–4096) for auto-ranging, further improving the dynamic range and linearity of the ADC. Experimental recordings with the system show spike signals in rat somatosensory cortex as well as alpha EEG activity in a human subject. PMID:20046962

  18. Micropower CMOS Integrated Low-Noise Amplification, Filtering, and Digitization of Multimodal Neuropotentials.

    PubMed

    Mollazadeh, M; Murari, K; Cauwenberghs, G; Thakor, N

    2009-02-01

    Electrical activity in the brain spans a wide range of spatial and temporal scales, requiring simultaneous recording of multiple modalities of neurophysiological signals in order to capture various aspects of brain state dynamics. Here, we present a 16-channel neural interface integrated circuit fabricated in a 0.5 mum 3M2P CMOS process for selective digital acquisition of biopotentials across the spectrum of neural signal modalities in the brain, ranging from single spike action potentials to local field potentials (LFP), electrocorticograms (ECoG), and electroencephalograms (EEG). Each channel is composed of a tunable bandwidth, fixed gain front-end amplifier and a programmable gain/resolution continuous-time incremental DeltaSigma analog-to-digital converter (ADC). A two-stage topology for the front-end voltage amplifier with capacitive feedback offers independent tuning of the amplifier bandpass frequency corners, and attains a noise efficiency factor (NEF) of 2.9 at 8.2 kHz bandwidth for spike recording, and a NEF of 3.2 at 140 Hz bandwidth for EEG recording. The amplifier has a measured midband gain of 39.6 dB, frequency response from 0.2 Hz to 8.2 kHz, and an input-referred noise of 1.94 muV rms while drawing 12.2 muA of current from a 3.3 V supply. The lower and higher cutoff frequencies of the bandpass filter are adjustable from 0.2 to 94 Hz and 140 Hz to 8.2 kHz, respectively. At 10-bit resolution, the ADC has an SNDR of 56 dB while consuming 76 muW power. Time-modulation feedback in the ADC offers programmable digital gain (1-4096) for auto-ranging, further improving the dynamic range and linearity of the ADC. Experimental recordings with the system show spike signals in rat somatosensory cortex as well as alpha EEG activity in a human subject. PMID:20046962

  19. 0.1 V 13 GHz Transformer-Based Quadrature Voltage-Controlled Oscillator with a Capacitor Coupling Technique in 90 nm Complementary Metal Oxide Semiconductor

    NASA Astrophysics Data System (ADS)

    Kamimura, Tatsuya; Lee, Sang-yeop; Tanoi, Satoru; Ito, Hiroyuki; Ishihara, Noboru; Masu, Kazuya

    2012-04-01

    A low power-supply voltage and high-frequency quadrature voltage-controlled oscillator (QVCO) using a combination of capacitor coupling and transformer feedback techniques is presented. The capacitor coupling technique can boost the transconductance of the LC-VCO core and coupling transconductance of QVCO at high frequency. Also, this technique can improve the quality factor of the QVCO at high frequency with low power-supply voltage, compared with the conventional QVCO. In addition, the capacitor coupling QVCO with transformer feedback can improve the quality factor of QVCO. Using this topology, the QVCO is able to operate at over 10 GHz with lower power-supply voltage. Implemented in the 90 nm complementary metal oxide semiconductor (CMOS) process, the proposed QVCO measures 1-MHz-offset phase noise of -94 dBc/Hz at 13 GHz while consuming 0.68 mW from a 0.1 V power-supply.

  20. Progress in voltage and current mode on-chip analog-to-digital converters for CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Panicacci, Roger; Pain, Bedabrata; Zhou, Zhimin; Nakamura, Junichi; Fossum, Eric R.

    1996-03-01

    Two 8 bit successive approximation analog-to-digital converter (ADC) designs and a 12 bit current mode incremental sigma delta ((Sigma) -(Delta) ) ADC have been designed, fabricated, and tested. The successive approximation test chip designs are compatible with active pixel sensor (APS) column parallel architectures with a 20.4 micrometers pitch in a 1.2 micrometers n-well CMOS process and a 40 micrometers pitch in a 2 micrometers n-well CMOS process. The successive approximation designs consume as little as 49 (mu) W at a 500 KHz conversion rate meeting the low power requirements inherent in column parallel architectures. The current mode incremental (Sigma) -(Delta) ADC test chip is designed to be multiplexed among 8 columns in a semi-column parallel current mode APS architecture. The higher accuracy ADC consumes 800 (mu) W at a 5 KHz conversion rate.

  1. A 75 ps rms time resolution BiCMOS time to digital converter optimized for high rate imaging detectors

    NASA Astrophysics Data System (ADS)

    Hervé, C.; Torki, K.

    2002-04-01

    This paper presents an integrated time to digital converter (TDC) with a bin size adjustable in the range of 125 to 175 ps and a differential nonlinearity of ±0.3%. The TDC has four channels. Its architecture has been optimized for the readout of imaging detectors in use at Synchrotron Radiation facilities. In particular, a built-in logic flags piled-up events. Multi-hit patterns are also supported for other applications. Time measurements are extracted off chip at the maximum throughput of 40 MHz. The dynamic range is 14 bits. It has been fabricated in 0.8 μm BiCMOS technology. Time critical inputs are PECL compatible whereas other signals are CMOS compatible. A second application specific integrated circuit (ASIC) has been developed which translates NIM electrical levels to PECL ones. Both circuits are used to assemble board level TDCs complying with industry standards like VME, NIM and PCI.

  2. CMOS time-to-digital converter based on a pulse-mixing scheme.

    PubMed

    Chen, Chun-Chi; Hwang, Chorng-Sii; Liu, Keng-Chih; Chen, Guan-Hong

    2014-11-01

    This paper proposes a new pulse-mixing scheme utilizing both pulse-shrinking and pulse-stretching mechanisms to improve the performance of time-to-digital converters (TDCs). The temporal resolution of the conventional pulse-shrinking mechanism is determined by the size ratio between homogeneous and inhomogeneous elements. The proposed scheme which features double-stage operation derives its resolution according to the time difference between pulse-shrinking and pulse-stretching amounts. Thus, it can achieve greater immunity against temperature and ambient variations than that of the single-stage scheme. The circuit area also can be reduced by the proposed pulse-mixing scheme. In addition, this study proposes an improved cyclic delay line to eliminate the undesirable shift in the temporal resolution successfully. Therefore, the effective resolution can be controlled completely by the pulse-mixing unit to improve accuracy. The proposed TDC composed of only one cyclic delay line and one counter is fabricated in a TSMC CMOS 0.35-μm DPQM process. The chip core occupies an extremely small area of 0.02 mm(2), which is the best among the related works. The experimental result shows that an effective resolution of around 53 ps within ±13% variation over a 0-100 °C temperature range is achieved. The power consumption is 90 μW at a sample rate of 1000 samples/s. In addition to the reduced area, the proposed TDC circuit achieves its resolution with less thermal-sensitivity and better fluctuations caused by process variations. PMID:25430128

  3. CMOS time-to-digital converter based on a pulse-mixing scheme

    NASA Astrophysics Data System (ADS)

    Chen, Chun-Chi; Hwang, Chorng-Sii; Liu, Keng-Chih; Chen, Guan-Hong

    2014-11-01

    This paper proposes a new pulse-mixing scheme utilizing both pulse-shrinking and pulse-stretching mechanisms to improve the performance of time-to-digital converters (TDCs). The temporal resolution of the conventional pulse-shrinking mechanism is determined by the size ratio between homogeneous and inhomogeneous elements. The proposed scheme which features double-stage operation derives its resolution according to the time difference between pulse-shrinking and pulse-stretching amounts. Thus, it can achieve greater immunity against temperature and ambient variations than that of the single-stage scheme. The circuit area also can be reduced by the proposed pulse-mixing scheme. In addition, this study proposes an improved cyclic delay line to eliminate the undesirable shift in the temporal resolution successfully. Therefore, the effective resolution can be controlled completely by the pulse-mixing unit to improve accuracy. The proposed TDC composed of only one cyclic delay line and one counter is fabricated in a TSMC CMOS 0.35-μm DPQM process. The chip core occupies an extremely small area of 0.02 mm2, which is the best among the related works. The experimental result shows that an effective resolution of around 53 ps within ±13% variation over a 0-100 °C temperature range is achieved. The power consumption is 90 μW at a sample rate of 1000 samples/s. In addition to the reduced area, the proposed TDC circuit achieves its resolution with less thermal-sensitivity and better fluctuations caused by process variations.

  4. Digital pixel CMOS focal plane array with on-chip multiply accumulate units for low-latency image processing

    NASA Astrophysics Data System (ADS)

    Little, Jeffrey W.; Tyrrell, Brian M.; D'Onofrio, Richard; Berger, Paul J.; Fernandez-Cull, Christy

    2014-06-01

    A digital pixel CMOS focal plane array has been developed to enable low latency implementations of image processing systems such as centroid trackers, Shack-Hartman wavefront sensors, and Fitts correlation trackers through the use of in-pixel digital signal processing (DSP) and generic parallel pipelined multiply accumulate (MAC) units. Light intensity digitization occurs at the pixel level, enabling in-pixel DSP and noiseless data transfer from the pixel array to the peripheral processing units. The pipelined processing of row and column image data prior to off chip readout reduces the required output bandwidth of the image sensor, thus reducing the latency of computations necessary to implement various image processing systems. Data volume reductions of over 80% lead to sub 10μs latency for completing various tracking and sensor algorithms. This paper details the architecture of the pixel-processing imager (PPI) and presents some initial results from a prototype device fabricated in a standard 65nm CMOS process hybridized to a commercial off-the-shelf short-wave infrared (SWIR) detector array.

  5. Materials and fabrication sequences for water soluble silicon integrated circuits at the 90 nm node

    NASA Astrophysics Data System (ADS)

    Yin, Lan; Bozler, Carl; Harburg, Daniel V.; Omenetto, Fiorenzo; Rogers, John A.

    2015-01-01

    Tungsten interconnects in silicon integrated circuits built at the 90 nm node with releasable configurations on silicon on insulator wafers serve as the basis for advanced forms of water-soluble electronics. These physically transient systems have potential uses in applications that range from temporary biomedical implants to zero-waste environmental sensors. Systematic experimental studies and modeling efforts reveal essential aspects of electrical performance in field effect transistors and complementary ring oscillators with as many as 499 stages. Accelerated tests reveal timescales for dissolution of the various constituent materials, including tungsten, silicon, and silicon dioxide. The results demonstrate that silicon complementary metal-oxide-semiconductor circuits formed with tungsten interconnects in foundry-compatible fabrication processes can serve as a path to high performance, mass-produced transient electronic systems.

  6. ArF processing of 90-nm design rule lithography achieved through enhanced thermal processing

    NASA Astrophysics Data System (ADS)

    Kagerer, Markus; Miller, Daniel; Chang, Wayne; Williams, Daniel J.

    2006-03-01

    As the lithography community has moved to ArF processing on 300 mm wafers for 90 nm design rules the process characterization of the components of variance continues to highlight the thermal requirements for the post exposure bake (PEB) processing step. In particular as the thermal systems have become increasingly uniform, the transient behavior of the thermal processing system has received the focus of attention. This paper demonstrates how a newly designed and patented thermal processing system was optimized for delivering improved thermal uniformity during a typical 90 second PEB processing cycle, rather than being optimized for steady state performance. This was accomplished with the aid of a wireless temperature measurement wafer system for obtaining real time temperature data and by using a response surface model (RSM) experimental design for optimizing parameters of the temperature controller of the thermal processing system. The new units were field retrofitted seamlessly in <2 days at customer sites without disruption to process recipes or flows. After evaluating certain resist parameters such as PEB temperature sensitivity and post exposure delay (PED) - stability of the baseline process, the new units were benchmarked against the previous PEB plates by processing a split lot experiment. Additional hardware characterization included environmental factors such as air velocity in the vicinity of the PEB plates and transient time between PEB and chill plate. At the completion of the optimization process, the within wafer CD uniformity displayed a significant improvement when compared to the previous hardware. The demonstrated within wafer CD uniformity improved by 27% compared to the initial hardware and baseline process. ITRS requirements for the 90 nm node were exceeded.

  7. Design and performance of a custom ASIC digitizer for wire chamber readout in 65 nm CMOS technology

    NASA Astrophysics Data System (ADS)

    Lee, M. J.; Brown, D. N.; Chang, J. K.; Ding, D.; Gnani, D.; Grace, C. R.; Jones, J. A.; Kolomensky, Y. G.; von der Lippe, H.; Mcvittie, P. J.; Stettler, M. W.; Walder, J.-P.

    2015-06-01

    We present the design and performance of a prototype ASIC digitizer for integrated wire chamber readout, implemented in 65 nm commercial CMOS technology. Each channel of the 4-channel prototype is composed of two 16-bit Time-to-Digital Converters (TDCs), one 8-bit Analog-to-Digital Converter (ADC), a front-end preamplifier and shaper, plus digital and analog buffers that support a variety of digitization chains. The prototype has a multiplexed digital backend that executes a state machine, distributes control and timing signals, and buffers data for serial output. Laboratory bench tests measure the absolute TDC resolution between 74 ps and 480 ps, growing with the absolute delay, and a relative time resolution of 19 ps. Resolution outliers due to cross-talk between clock signals and supply or reference voltages are seen. After calibration, the ADC displays good linearity and noise performance, with an effective number of bits of 6.9. Under normal operating conditions the circuit consumes 32 mW per channel. Potential design improvements to address the resolution drift and tails are discussed.

  8. A three-axis micromachined accelerometer with a CMOS position-sense interface and digital offset-trim electronics

    SciTech Connect

    Lemkin, M.; Boser, B.E.

    1999-04-01

    This paper describes a three-axis accelerometer implemented in a surface-micromachining technology with integrated CMOS. The accelerometer measures changes in a capacitive half-bridge to detect deflections of a proof mass, which result from acceleration input. The half-bridge is connected to a fully differential position-sense interface, the output of which is used for one-bit force feedback. By enclosing the proof mass in a one-bit feedback loop, simultaneous force balancing and analog-to-digital conversion are achieved. On-chip digital offset-trim electronics enable compensation of random offset in the electronic interface. Analytical performance calculations are shown to accurately model device behavior. The fabricated single-chip accelerometer measures 4 {times} 4 mm{sup 2}, draws 27 mA from a 5-V supply, and has a dynamic range of 84, 81, and 70 dB along the x-, y-, and z-axes, respectively.

  9. Large area CMOS active pixel sensor x-ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

    SciTech Connect

    Zhao, Chumin; Kanicki, Jerzy; Konstantinidis, Anastasios C.; Patel, Tushita

    2015-11-15

    Purpose: Large area x-ray imagers based on complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology have been proposed for various medical imaging applications including digital breast tomosynthesis (DBT). The low electronic noise (50–300 e{sup −}) of CMOS APS x-ray imagers provides a possible route to shrink the pixel pitch to smaller than 75 μm for microcalcification detection and possible reduction of the DBT mean glandular dose (MGD). Methods: In this study, imaging performance of a large area (29 × 23 cm{sup 2}) CMOS APS x-ray imager [Dexela 2923 MAM (PerkinElmer, London)] with a pixel pitch of 75 μm was characterized and modeled. The authors developed a cascaded system model for CMOS APS x-ray imagers using both a broadband x-ray radiation and monochromatic synchrotron radiation. The experimental data including modulation transfer function, noise power spectrum, and detective quantum efficiency (DQE) were theoretically described using the proposed cascaded system model with satisfactory consistency to experimental results. Both high full well and low full well (LFW) modes of the Dexela 2923 MAM CMOS APS x-ray imager were characterized and modeled. The cascaded system analysis results were further used to extract the contrast-to-noise ratio (CNR) for microcalcifications with sizes of 165–400 μm at various MGDs. The impact of electronic noise on CNR was also evaluated. Results: The LFW mode shows better DQE at low air kerma (K{sub a} < 10 μGy) and should be used for DBT. At current DBT applications, air kerma (K{sub a} ∼ 10 μGy, broadband radiation of 28 kVp), DQE of more than 0.7 and ∼0.3 was achieved using the LFW mode at spatial frequency of 0.5 line pairs per millimeter (lp/mm) and Nyquist frequency ∼6.7 lp/mm, respectively. It is shown that microcalcifications of 165–400 μm in size can be resolved using a MGD range of 0.3–1 mGy, respectively. In comparison to a General Electric GEN2 prototype DBT system (at

  10. A High Speed CMOS Image Sensor with a Novel Digital Correlated Double Sampling and a Differential Difference Amplifier

    PubMed Central

    Kim, Daehyeok; Bae, Jaeyoung; Song, Minkyu

    2015-01-01

    In order to increase the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, the fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a novel digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 µm CIS technology and it has the VGA resolution of 640 × 480. The measured conversion time is 16 µs, and a high frame rate of 131 fps is achieved at the VGA resolution. PMID:25738765

  11. A high speed CMOS image sensor with a novel digital correlated double sampling and a differential difference amplifier.

    PubMed

    Kim, Daehyeok; Bae, Jaeyoung; Song, Minkyu

    2015-01-01

    In order to increase the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, the fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a novel digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 µm CIS technology and it has the VGA resolution of 640 × 480. The measured conversion time is 16 µs, and a high frame rate of 131 fps is achieved at the VGA resolution. PMID:25738765

  12. Optimum PEC Conditions Under Resist Heating Effect Reduction for 90nm Node Mask Writing

    NASA Astrophysics Data System (ADS)

    Park, Eu Sang; Lee, Jong Hwa; Park, Dong Il; Jeong, Woo Gun; Seo, Soon Kyu; Kim, Jin Min; Choi, Sang-Soo; Jeong, Soo-Hong

    2002-12-01

    For high-voltage vector e-beam writing systems, solving the resist heating effect problem is one of the highest priorities because it is a major factor affecting localized critical dimension (CD) uniformity. In order to write patterns for 90nm node devices, the utilization of proximity effect correction (PEC) is essential for e-beam mask writers to achieve high CD performance. In this study, the dependence of CD variation on e-beam write conditions was investigated under optimum PEC parameter conditions. Writing conditions such as current density, shot size, number of writing passes, and settling time were tested to see their affects on resist heating. Industry-standard Nippon Zeon ZEP 7000 resist was written by a Toshiba EBM-3500B 50KeV vector e-beam writer using patterns found in sub-130nm node devices. Results indicated that the main factor affecting resist heating CD variation for ZEP 7000 was in fact the e-beam writer shot size selected. Multi-pass writing was effective in reducing the CD variation, and the settling time of each shot in the EBM-3500B had very little influence.

  13. In-line 90 nm Technology Gate Oxide Nitrogen Monitoring With Non-Contact Electrical Technique

    NASA Astrophysics Data System (ADS)

    Pic, Nicolas; Polisski, Gennadi; Paire, Emmanuel; Rizzo, Véronique; Grosjean, Catherine; Bortolotti, Benjamin; D'Amico, John; Cabuil, Nicolas

    2009-09-01

    The continuous race to reduce the dimensions of IC components has lead to the introduction of Nitrogen in the thin gate oxide layer in order to increase the dielectric constant and to improve the gate dielectric properties. It is mandatory to apply in-line monitoring to control the amount of Nitrogen to ensure that electrical behavior is correct over time. Historically, this monitoring was performed by measuring the delay to reoxidation (D2R) with an ellipsometer. But, this method is not suitable in production as it is depending on both initial oxidation and reoxidation reproducibility, which implies implementing dedicated Statistical Process Control (SPC) monitoring at these two specific processing steps. We are here presenting an alternative method to D2R for 90 nm Technology gate oxide grown by Rapid Thermal Process (RTP). Applying a non-contact Metrology technique, which couples Kelvin probe surface voltage measurement with surface Corona deposition, directly after the nitridation step, the interface trapped charge (QIT) is obtained by integration of the interface state density over the space charge region. In summary, this electrical non-contact monitoring is more sensitive to the Nitrogen content compared to ellipsometer measurement after nitridation or after D2R, less sensitive compared to D2R to any initial oxide variation, and it allows simplification of the qualification procedure at this process step by skipping the reoxidation.

  14. Asymmetric MQW semiconductor optical amplifier with low-polarization sensitivity of over 90-nm bandwidth

    NASA Astrophysics Data System (ADS)

    Nkanta, Julie E.; Maldonado-Basilio, Ramón; Abdul-Majid, Sawsan; Zhang, Jessica; Hall, Trevor J.

    2013-12-01

    An exhausted capacity of current Passive Optical Networks has been anticipated as bandwidth-hungry applications such as HDTV and 3D video become available to end-users. To enhance their performance, the next generation optical access networks have been proposed, using optical carriers allocated within the E-band (1360-1460 nm). It is partly motivated by the low-water peak fiber being manufactured by Corning. At these wavelengths, choices for low cost optical amplifiers, with compact size, low energy consumption and feasibility for integration with other optoelectronic components are limited, making the semiconductor optical amplifiers (SOA) a realistic solution. An experimental characterization of a broadband and low polarization sensitive asymmetric multi quantum well (MQW) SOA operating in the E-band is reported. The SOA device is composed of nine 6 nm In1-xGaxAsyP1-y 0.2% tensile strained asymmetric MQW layers sandwiched between nine latticed matched 6 nm InGaAsP barrier layers. The active region is grown on an n-doped InP substrate and buried by p-doped InGaAsP layers. The SOA devices have 7-degrees tilt anti-reflected coated facets, with 2 μm ridge width, and a cavity length of 900 μm. For input powers of -10 dBm and -20 dBm, a maximum gain of 20 dB at 1360 nm with a polarization insensitivity under 3 dB for over 90 nm bandwidth is measured. Polarization sensitivity of less than 0.5 dB is observed for some wavelengths. Obtained results indicate a promising SOA with broadband amplification, polarization insensitivity and high gain. These SOAs were designed and characterized at the Photonics Technology Laboratory, University of Ottawa, Canada.

  15. IR CMOS: the digital nightvision solution to sub-1 mLux imaging

    NASA Astrophysics Data System (ADS)

    Pralle, M. U.; Carey, J. E.; Vineis, C.; Palsule, C.; Jiang, J.; Joy, T.

    2015-05-01

    SiOnyx has demonstrated imaging at light levels below 1 mLux at 60 FPS with a 720P CMOS image sensor in a compact, low latency camera. The camera contains a 1 inch (16 mm) optical format sensor and streams uncompressed video over CameraLink with row wise image latency below 1 msec. Sub mLux imaging is enabled by the combination of enhanced quantum efficiency in the near infrared together with state of the art low noise image sensor design. The quantum efficiency enhancement is achieved by utilizing SiOnyx's proprietary ultrafast laser semiconductor processing technology that enhances the absorption of light within a thin pixel layer. Our technology demonstrates a 10 fold improvement in infrared sensitivity over incumbent imaging technology while maintaining complete compatibility with standard CMOS image sensor process flows. Applications include surveillance, nightvision, and 1064nm laser see-spot.

  16. Total Dose Effects on Single Event Transients in Digital CMOS and Linear Bipolar Circuits

    NASA Technical Reports Server (NTRS)

    Buchner, S.; McMorrow, D.; Sibley, M.; Eaton, P.; Mavis, D.; Dusseau, L.; Roche, N. J-H.; Bernard, M.

    2009-01-01

    This presentation discusses the effects of ionizing radiation on single event transients (SETs) in circuits. The exposure of integrated circuits to ionizing radiation changes electrical parameters. The total ionizing dose effect is observed in both complementary metal-oxide-semiconductor (CMOS) and bipolar circuits. In bipolar circuits, transistors exhibit grain degradation, while in CMOS circuits, transistors exhibit threshold voltage shifts. Changes in electrical parameters can cause changes in single event upset(SEU)/SET rates. Depending on the effect, the rates may increase or decrease. Therefore, measures taken for SEU/SET mitigation might work at the beginning of a mission but not at the end following TID exposure. The effect of TID on SET rates should be considered if SETs cannot be tolerated.

  17. A fully integrated direct-conversion digital satellite tuner in 0.18 μm CMOS

    NASA Astrophysics Data System (ADS)

    Si, Chen; Zengwang, Yang; Mingliang, Gu

    2011-04-01

    A fully integrated direct-conversion digital satellite tuner for DVB-S/S2 and ABS-S applications is presented. A broadband noise-canceling Balun-LNA and passive quadrature mixers provided a high-linearity low noise RF front-end, while the synthesizer integrated the loop filter to reduce the solution cost and system debug time. Fabricated in 0.18 μm CMOS, the chip achieves a less than 7.6 dB noise figure over a 900-2150 MHz L-band, while the measured sensitivity for 4.42 MS/s QPSK-3/4 mode is -91 dBm at the PCB connector. The fully integrated integer-N synthesizer operating from 2150 to 4350 MHz achieves less than 1 °C integrated phase error. The chip consumes about 145 mA at a 3.3 V supply with internal integrated LDOs.

  18. A 16 b 2 GHz digital-to-analog converter in 0.18 μm CMOS with digital calibration technology

    NASA Astrophysics Data System (ADS)

    Weidong, Yang; Jiandong, Zang; Tiehu, Li; Pu, Luo; Jie, Pu; Ruitao, Zhang; Chao, Chen

    2015-10-01

    This paper presents a 16-bit 2 GSPS digital-to-analog converter (DAC) in 0.18 μm CMOS technology. This DAC is implemented using time division multiplex access system architecture in the digital domain. The input data is received with a two-channel LVDS interface. The DLL technology is introduced to meet the timing requirements between phases of the LVDS data and the data sampling clock. A FIFO is designed to absorb the phase difference between the data clock and DAC system clock. A delay controller is integrated to adjust the phase relationship between the high speed digital clock and analog clock, obtaining a sampling rate of 2 GSPS. The current source mismatch at higher bits is calibrated in the digital domain. Test results show that the DAC achieves 74.02 dBC SFDR at analog output of 36 MHz, and DNL less than ±2.1 LSB & INL less than ±4.3 LSB after the chip is calibrated.

  19. DOE experiment for scattering bars optimization at the 90nm node

    NASA Astrophysics Data System (ADS)

    Bouton, G.; Connolly, B.; Courboin, D.; Di Giacomo, A.; Gasnier, F.; Lallement, R.; Parker, D.; Pindo, M.; Richoilley, J. C.; Royere, F.; Rameau-Savio, A.; Tissier, M.

    2011-03-01

    Scattering bars (SB) are sub-resolution lines added to the original database during Resolution Enhancement Techniques (RET) treatments. Their goal is stabilizing the CD of the adjacent polygons (by suppressing or reducing secondary diffraction waves). SB increase the process window in the litho process by lowering the first derivative of the CD. Moreover, the detailed knowledge of SB behavior around the fab working point is a must for future shrinks and for preparing the next technology nodes. SB are inserted in the generation of critical levels for STMicroelectronics 90 nm technology embedded memories before invoking the Model for Optical Proximity Corrections (MBOPC). This allows the software to calculate their contribution to the intensity in the aerial image and integrate their effects in Edge Proximity Error (EPE) corrections. However the Rule-Based insertion of these assist features still leaves behind occurrences of conflicting priorities as in the image below. (See manuscript PDF)Detection of Hot Spots in 2D simulations for die treatment validation (done on BRION equipment on each critical level before mask making) is in most cases correlated with SB singularities, at least for CD non-uniformity, bridging issues and necking in correspondence with OPC fragmentation effects. Within the framework of the MaXSSIMM project, we established a joint STMicroelectronics and Toppan Photomasks team to explore the influence of assist features (CD, distance), convex and concave corner rounding and CD uniformity by means of specific test patterns. The proposed study concerns the algorithms used to define the mask shop input as well as the physical mask etching. A set of test cases, based on elementary test patterns, each one including a list of geometrical variations, has been defined. As the number of configurations becomes rapidly very large (tens of thousands) we had to apply Design of Experiments (DOE) algorithms in order to reduce the number of measurements to a

  20. Digital standard cells and operational amplifiers for operation up to 250 degrees C using low-cost CMOS technology

    NASA Astrophysics Data System (ADS)

    Stemmer, Jens; Ackermann, Joerg; Uffmann, Dirk; Aderhold, Jochen

    1996-09-01

    There is an increasing demand from automotive, aircraft and space industry for reliable high temperature resistant electronics. Circuits with reliable functionality up to temperatures of 250 degree(s)C would be sufficient for most of these applications. Digital standard cells and operational amplifiers are the basic building blocks of these circuits. Commercially available digital standard cell libraries and operational amplifiers are normally specified for operation up to a maximum temperature of 125 degree(s)C. Hence, the purpose of this work was the design and characterization of digital standard cells and operational amplifiers for operation up to 250 degree(s)C using a low-cost 1.0 micrometers epi-CMOS process. Several design measures were applied to the cells in order to further improve latch-up resistivity and to limit leakage currents, respectively. The transfer curves of all digital cells for all input signal combinations have been recorded in the temperature range from 30 to 250 degree(s)C. Significant results are very low temperature shifts of the noise margins and of the switching point, respectively. Furthermore, the low (0 V) and high (5 V) levels are reached exactly over the entire temperature range. Outstanding characteristics of the operational amplifier comprise low open-loop gain temperature drift as well as low offset and offset temperature drift, respectively. The open-loop gain was greater than 83 dB at room temperature with a drift of less than 0.02 dB/ degree(s)C. The offset voltage amounted to -1 mV at room temperature and 1 mV at 250 degree(s)C, respectively. The long-term behavior of these cells is currently under investigation.

  1. A digitally compensated 1.5 GHz CMOS/FBAR frequency reference.

    PubMed

    Rai, Shailesh; Su, Ying; Pang, Wei; Ruby, Richard; Otis, Brian

    2010-03-01

    A temperature-compensated 1.5 GHz film bulk acoustic wave resonator (FBAR)-based frequency reference implemented in a 0.35 microm CMOS process is presented. The ultra-small form factor (0.79 mm x 1.72 mm) and low power dissipation (515 microA with 2 V supply) of a compensated FBAR oscillator present a promising alternative for the replacement of quartz crystal frequency references. The measured post-compensation frequency drift over a 0-100 degrees C temperature range is < +/- 10 ppm. The measured oscillator phase noise is -133 dBc/Hz at 100 kHz offset from the 1.5 GHz carrier. PMID:20211770

  2. A 12-bit high-speed column-parallel two-step single-slope analog-to-digital converter (ADC) for CMOS image sensors.

    PubMed

    Lyu, Tao; Yao, Suying; Nie, Kaiming; Xu, Jiangtao

    2014-01-01

    A 12-bit high-speed column-parallel two-step single-slope (SS) analog-to-digital converter (ADC) for CMOS image sensors is proposed. The proposed ADC employs a single ramp voltage and multiple reference voltages, and the conversion is divided into coarse phase and fine phase to improve the conversion rate. An error calibration scheme is proposed to correct errors caused by offsets among the reference voltages. The digital-to-analog converter (DAC) used for the ramp generator is based on the split-capacitor array with an attenuation capacitor. Analysis of the DAC's linearity performance versus capacitor mismatch and parasitic capacitance is presented. A prototype 1024 × 32 Time Delay Integration (TDI) CMOS image sensor with the proposed ADC architecture has been fabricated in a standard 0.18 μm CMOS process. The proposed ADC has average power consumption of 128 μW and a conventional rate 6 times higher than the conventional SS ADC. A high-quality image, captured at the line rate of 15.5 k lines/s, shows that the proposed ADC is suitable for high-speed CMOS image sensors. PMID:25407903

  3. Phase-change memory technology with self-aligned μTrench cell architecture for 90 nm node and beyond

    NASA Astrophysics Data System (ADS)

    Pirovano, A.; Pellizzer, F.; Tortorelli, I.; Riganó, A.; Harrigan, R.; Magistretti, M.; Petruzza, P.; Varesi, E.; Redaelli, A.; Erbetta, D.; Marangon, T.; Bedeschi, F.; Fackenthal, R.; Atwood, G.; Bez, R.

    2008-09-01

    A novel self-aligned μTrench-based cell architecture for phase change memory (PCM) process is presented. The low programming current and the good dimensional control of the sub-lithographic features achieved with the μTrench structure are combined with a self-aligned patterning strategy that simplify the integration process in term of alignment tolerances and of number of critical masks. The proposed architecture has been integrated in a 90 nm 128 Mb vehicle based on a pnp bipolar junction transistor for the array selection. The good active and leakage currents achieved by the purposely optimized selecting transistors combined with programming currents of 300 μA of the storage element and good distributions measured on the 128 Mb array demonstrate the suitability of the proposed architecture for the production of high-density PCM arrays at 90 nm and beyond.

  4. High performance CMOS image sensor for digitally fused day/night vision systems

    NASA Astrophysics Data System (ADS)

    Fowler, Boyd; Vu, Paul; Liu, Chiao; Mims, Steve; Do, Hung; Li, Wang; Appelbaum, Jeff

    2010-04-01

    We present the performance of a CMOS image sensor optimized for next generation fused day/night vision systems. The device features 5T pixels with pinned photodiodes on a 6.5μm pitch with integrated micro-lens. The 5T pixel architecture enables both correlated double sampling (CDS) to reduce noise for night time operation, and a lateral antiblooming drain for day time operation. The measured peak quantum efficiency of the sensor is above 55% at 600nm, and the median read noise is less than 1e- RMS at room temperature. The sensor features dual gain 11-bit data output ports and supports 30 fps and 60 fps. The full well capacity is greater than 30ke-, the dark current is less than 3.8pA/cm2 at 20ºC, and the MTF at 77 lp/mm is 0.4 at 550nm. The sensor also achieves an intra-scene linear dynamic range of greater than 90dB (30000:1) for night time operation, and an inter-scene linear dynamic range of greater than 150dB for complete day/night operability.

  5. CAOS-CMOS camera.

    PubMed

    Riza, Nabeel A; La Torre, Juan Pablo; Amin, M Junaid

    2016-06-13

    Proposed and experimentally demonstrated is the CAOS-CMOS camera design that combines the coded access optical sensor (CAOS) imager platform with the CMOS multi-pixel optical sensor. The unique CAOS-CMOS camera engages the classic CMOS sensor light staring mode with the time-frequency-space agile pixel CAOS imager mode within one programmable optical unit to realize a high dynamic range imager for extreme light contrast conditions. The experimentally demonstrated CAOS-CMOS camera is built using a digital micromirror device, a silicon point-photo-detector with a variable gain amplifier, and a silicon CMOS sensor with a maximum rated 51.3 dB dynamic range. White light imaging of three different brightness simultaneously viewed targets, that is not possible by the CMOS sensor, is achieved by the CAOS-CMOS camera demonstrating an 82.06 dB dynamic range. Applications for the camera include industrial machine vision, welding, laser analysis, automotive, night vision, surveillance and multispectral military systems. PMID:27410361

  6. A multi-path gated ring oscillator based time-to-digital converter in 65 nm CMOS technology

    NASA Astrophysics Data System (ADS)

    Chen, Jiang; Yumei, Huang; Zhiliang, Hong

    2013-03-01

    A gated ring oscillator (GRO) based time-to-digital converter (TDC) is presented. To enhance the resolution of the TDC, a multi-path structure for the GRO is used to achieve a higher oscillation frequency and an input stage is also presented to equivalently amplify the input time difference with a gain of 2. The GRO based TDC circuit is fabricated in TSMC 65 nm CMOS technology and the core area is about 0.02 mm2. According to the measurement results, the effective resolution of this circuit is better than 4.22 ps under a 50 MHz clock frequency. With a 1 ns input range, the maximum clock frequency of this circuit is larger than 200 MHz. Under a 1 V power supply, with a 200-800 ps input time difference, the measured power consumption is 1.24 to 1.72 mW at 50 MHz clock frequency and 1.73 to 2.20 mW at 200 MHz clock frequency.

  7. Low-k/copper integration scheme suitable for ULSI manufacturing from 90nm to 45nm nodes

    NASA Astrophysics Data System (ADS)

    Nogami, T.; Lane, S.; Fukasawa, M.; Ida, K.; Angyal, M.; Chanda, K.; Chen, F.; Christiansen, C.; Cohen, S.; Cullinan, M.; Dziobkowski, C.; Fitzsimmons, J.; Flaitz, P.; Grill, A.; Gill, J.; Inoue, K.; Klymko, N.; Kumar, K.; Labelle, C.; Lane, M.; Li, B.; Liniger, E.; Madon, A.; Malone, K.; Martin, J.; McGahay, V.; McLaughlin, P.; Melville, I.; Minami, M.; Molis, S.; Nguyen, S.; Penny, C.; Restaino, D.; Sakamoto, A.; Sankar, M.; Sherwood, M.; Simonyi, E.; Shimooka, Y.; Tai, L.; Widodo, J.; Wildman, H.; Ono, M.; McHerron, D.; Nye, H.; Davis, C.; Sankaran, S.; Edelstein, D.; Ivers, T.

    2005-11-01

    This paper discusses low-k/copper integration schemes which has been in production in the 90 nm node, have been developed in the 65 nm node, and should be taken in the 45 nm node. While our baseline 65 nm BEOL process has been developed by extension and simple shrinkage of our PECVD SiCOH integration which has been in production in the 90 nm node with our SiCOH film having k=3.0, the 65 nm SiCOH integration has two other options to go to extend to lower capacitance. One is to add porosity to become ultra low-k (ULK). The other is to stay with low-k SiCOH, which is modified to have a "lower-k". The effective k- value attained with the lower-k (k=2.8) SiCOH processed in the "Direct CMP" scheme is very close to that with an ULK (k=2.5) SiCOH film built with the "Hard Mask Retention" scheme. This paper first describes consideration of these two damascene schemes, whose comparison leads to the conclusion that the lower-k SiCOH integration can have more advantages in terms of process simplicity and extendibility of our 90 nm scheme under certain assumptions. Then describing the k=2.8 SiCOH film development and its successful integration, damascene schemes for 45nm nodes are discussed based on our learning from development of the lower-k 65nm scheme. Capability of modern dry etchers to define the finer patterns, non-uniformity of CMP, and susceptibility to plasma and mechanical strength and adhesion of ULK are discussed as factors to hamper the applicability of ULK.

  8. Performance comparison of CMOS-based photodiodes for high-resolution and high-sensitivity digital mammography

    NASA Astrophysics Data System (ADS)

    Bae, J. H.; Cho, M.; Kim, M. S.; Lee, D. H.; Cho, G.

    2011-12-01

    In order to develop a high-resolution and high-sensitivity digital mamographic detector, to use a commercially-available and well-developed CMOS image sensor (CIS) process can be a cost-effective way. However, in any commercial CIS process, several different types of n- or p-layers can be used so that various pn-junction structures could be formed depending on the choice of n- and p-layer combination. We performed a comparative analysis on the characteristics of three types of photodiodes formed on a high-resistivity p-type epitaxial wafer by applying three available n-layer processes in order to develop the high-sensitivity photodiode for a scintillator-based X-ray imaging detector. As a preliminar study, a small test-version CIS chip with an 80 × 80 pixel array of a 3-transistor active pixel sensor structure, 50 μm pitch and 80{%} fill factor was fabricated. The pixel area is subdivided into four 40 × 40 sub-arrays and 3 different types of photodides are designed for each sub-array by using n+, n- and n-well layers. All other components are designed to be identical for impartial comparison of the photodiodes only. Among 3 types, the n-/p-epi photodiode exhibited high charge-to-voltage gain (0.86 μV/e-), high quantum efficiency (49% at 532 nm wavelength) and low dark current (294 pA/cm2). The test CIS chip was coupled to a phosphor screen, Lanex Fine or Lanex Regular, both composed of Gd2O2S:Tb, and was tested using X-rays in a mammography setting. Among 6 cases, n-/p-epi photodiode coupled with the Lanex Regular also showed the highest sensitivity of 30.5 mV/mR.

  9. 50 μm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis

    NASA Astrophysics Data System (ADS)

    Zhao, C.; Konstantinidis, A. C.; Zheng, Y.; Anaxagoras, T.; Speller, R. D.; Kanicki, J.

    2015-12-01

    Wafer-scale CMOS active pixel sensors (APSs) have been developed recently for x-ray imaging applications. The small pixel pitch and low noise are very promising properties for medical imaging applications such as digital breast tomosynthesis (DBT). In this work, we evaluated experimentally and through modeling the imaging properties of a 50 μm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). A modified cascaded system model was developed for CMOS APS x-ray detectors by taking into account the device nonlinear signal and noise properties. The imaging properties such as modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE) were extracted from both measurements and the nonlinear cascaded system analysis. The results show that the DynAMITe x-ray detector achieves a high spatial resolution of 10 mm-1 and a DQE of around 0.5 at spatial frequencies  <1 mm-1. In addition, the modeling results were used to calculate the image signal-to-noise ratio (SNRi) of microcalcifications at various mean glandular dose (MGD). For an average breast (5 cm thickness, 50% glandular fraction), 165 μm microcalcifications can be distinguished at a MGD of 27% lower than the clinical value (~1.3 mGy). To detect 100 μm microcalcifications, further optimizations of the CMOS APS x-ray detector, image aquisition geometry and image reconstruction techniques should be considered.

  10. 50 μm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis.

    PubMed

    Zhao, C; Konstantinidis, A C; Zheng, Y; Anaxagoras, T; Speller, R D; Kanicki, J

    2015-12-01

    Wafer-scale CMOS active pixel sensors (APSs) have been developed recently for x-ray imaging applications. The small pixel pitch and low noise are very promising properties for medical imaging applications such as digital breast tomosynthesis (DBT). In this work, we evaluated experimentally and through modeling the imaging properties of a 50 μm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). A modified cascaded system model was developed for CMOS APS x-ray detectors by taking into account the device nonlinear signal and noise properties. The imaging properties such as modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE) were extracted from both measurements and the nonlinear cascaded system analysis. The results show that the DynAMITe x-ray detector achieves a high spatial resolution of 10 mm(-1) and a DQE of around 0.5 at spatial frequencies  <1 mm(-1). In addition, the modeling results were used to calculate the image signal-to-noise ratio (SNRi) of microcalcifications at various mean glandular dose (MGD). For an average breast (5 cm thickness, 50% glandular fraction), 165 μm microcalcifications can be distinguished at a MGD of 27% lower than the clinical value (~1.3 mGy). To detect 100 μm microcalcifications, further optimizations of the CMOS APS x-ray detector, image aquisition geometry and image reconstruction techniques should be considered. PMID:26540090

  11. Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm

    NASA Astrophysics Data System (ADS)

    Abo, Satoshi; Masuda, Naoyuki; Wakaya, Fujio; Onoda, Shinobu; Hirao, Toshio; Ohshima, Takeshi; Iwamatsu, Toshiaki; Takai, Mikio

    2010-06-01

    The difference of soft error rates (SERs) in conventional bulk Si and silicon-on-insulator (SOI) static random access memories (SRAMs) with a technology node of 90 nm has been investigated by helium ion probes with energies ranging from 0.8 to 6.0 MeV and a dose of 75 ions/μm 2. The SERs in the SOI SRAM were also investigated by oxygen ion probes with energies ranging from 9.0 to 18.0 MeV and doses of 0.14-0.76 ions/μm 2. The soft error in the bulk and SOI SRAMs occurred by helium ion irradiation with energies at and above 1.95 and 2.10 MeV, respectively. The SER in the bulk SRAM saturated with ion energies at and above 2.5 MeV. The SER in the SOI SRAM became the highest by helium ion irradiation at 2.5 MeV and drastically decreased with increasing the ion energies above 2.5 MeV, in which helium ions at this energy range generated the maximum amount of excess charge carriers in a SOI body. The soft errors occurred by helium ions were induced by a floating body effect due to generated excess charge carriers in the channel regions. The soft error occurred by oxygen ion irradiation with energies at and above 10.5 MeV in the SOI SRAM. The SER in the SOI SRAM gradually increased with energies from 10.5 to 13.5 MeV and saturated at 18 MeV, in which the amount of charge carriers induced by oxygen ions in this energy range gradually increased. The computer calculation indicated that the oxygen ions with energies above 13.0 MeV generated more excess charge carriers than the critical charge of the 90 nm node SOI SRAM with the designed over-layer thickness. The soft errors, occurred by oxygen ions with energies at and below 12.5 MeV, were induced by a floating body effect due to the generated excess charge carriers in the channel regions and those with energies at and above 13.0 MeV were induced by both the floating body effect and generated excess carriers. The difference of the threshold energy of the oxygen ions between the experiment and the computer calculation might

  12. Ion traps fabricated in a CMOS foundry

    SciTech Connect

    Mehta, K. K.; Ram, R. J.; Eltony, A. M.; Chuang, I. L.; Bruzewicz, C. D.; Sage, J. M. Chiaverini, J.

    2014-07-28

    We demonstrate trapping in a surface-electrode ion trap fabricated in a 90-nm CMOS (complementary metal-oxide-semiconductor) foundry process utilizing the top metal layer of the process for the trap electrodes. The process includes doped active regions and metal interconnect layers, allowing for co-fabrication of standard CMOS circuitry as well as devices for optical control and measurement. With one of the interconnect layers defining a ground plane between the trap electrode layer and the p-type doped silicon substrate, ion loading is robust and trapping is stable. We measure a motional heating rate comparable to those seen in surface-electrode traps of similar size. This demonstration of scalable quantum computing hardware utilizing a commercial CMOS process opens the door to integration and co-fabrication of electronics and photonics for large-scale quantum processing in trapped-ion arrays.

  13. Nanoscale dimensional focused ion beam repair of quartz defects on 90-nm node alternating aperture phase shift masks

    NASA Astrophysics Data System (ADS)

    Robinson, Tod E.; Graupera, Anthony; Morrison, Troy B.; Ramstein, Marcus

    2004-08-01

    The effort to produce perfect dimension repairs of quartz bump defects on Alternating-Aperture Phase Shift Masks (AAPSM) has been brought to a new level with process developments to meet 90 nm technology node specifications. Decreasing photomask line and space dimensions pushes performance requirements for a mask repair system in terms of fine control in difficult to access structures on the mask surface. New repair strategies using a recently improved focused ion beam mask repair system for different defect types are discussed, along with their relative effectiveness. These strategies are then applied to the repair of full height extension and bridging defects in a line and space array. The role of quartz topography and its optical effects, Cr edge bias, and the combination of both strategies in a quartz bump repair are discussed. Additionally, effective process controls in repair are also discussed, along with analysis of metrology data received from a stylus nano-profilometer (SNP) system, and their relationship to potential imaging on the wafer by examination of AIMS data at a high numerical aperture. Several possible mask repair process flows are also reviewed in light of this work.

  14. Digital pixel readout integrated circuit architectures for LWIR

    NASA Astrophysics Data System (ADS)

    Shafique, Atia; Yazici, Melik; Kayahan, Huseyin; Ceylan, Omer; Gurbuz, Yasar

    2015-06-01

    This paper presents and discusses digital pixel readout integrated circuit architectures for long wavelength infrared (LWIR) in CMOS technology. Presented architectures are designed for scanning and staring arrays type detectors respectively. For scanning arrays, digital time delay integration (TDI) is implemented on 8 pixels with sampling rate up to 3 using CMOS 180nm technology. Input referred noise of ROIC is below 750 rms electron meanwhile power dissipation is appreciably under 30mW. ROIC design is optimized to perform at room as well as cryogenic temperatures. For staring type arrays, a digital pixel architecture relying on coarse quantization with pulse frequency modulation (PFM) and novel approach of extended integration is presented. It can achieve extreme charge handling capacity of 2.04Ge- with 20 bit output resolution and power dissipation below 350 nW in CMOS 90nm technology. Efficient mechanism of measuring the time to estimate the remaining charge on integration capacitor in order to achieve low SNR has employed.

  15. A programmable second order oversampling CMOS sigma-delta analog-to-digital converter for low-power sensor interface electronics

    NASA Astrophysics Data System (ADS)

    Soundararajan, R.; Srivastava, A.; Xu, Y.

    2010-04-01

    A programmable second order oversampling sigma-delta analog-to-digital converter (ADC) is designed and fabricated in 0.5 μm n-well CMOS process for low-power interface electronics of a sensor node in wireless sensor networks. The sigma-delta ADC can be programmed to operate at three different oversampling ratios of 16, 32, and 64 to give three different resolutions of 9, 12 and 14 bits, respectively which impact the power consumption of the sensor module. The major part of power is consumed in the decimator of the ADC by the integrators which operate at the highest sampling rate. Hence, an alternate design is introduced in the integrator stages by inserting sign extension coder circuits and reusing the same integrators for different resolutions and oversampling ratios. The programmable ADC can be interfaced with on or off-chip nanosensors for detection of traces of toxic gases and chemicals.

  16. A power-efficient 12-bit analog-to-digital converter with a novel constant-resistance CMOS input sampling switch

    NASA Astrophysics Data System (ADS)

    Xin, Jing; Yiqi, Zhuang; Hualian, Tang; Li, Dai; Yongqian, Du; Li, Zhang; Hongbo, Duan

    2014-02-01

    A power-efficient 12-bit 40-MS/s pipeline analog-to-digital converter (ADC) implemented in a 0.13 μm CMOS technology is presented. A novel CMOS bootstrapping switch, which offers a constant on-resistance over the entire input signal range, is used at the sample-and-hold front-end to enhance the dynamic performance of the pipelined ADC. By implementing with 2.5-bit-per-stage and a simplified amplifier sharing architecture between two successive pipeline stages, a very competitive power consumption and small die area can be achieved. Meanwhile, the substrate-biasing-effect attenuated T-type switches are introduced to reduce the crosstalk between the two opamp sharing successive stages. Moreover, a two-stage gain boosted recycling folded cascode (RFC) amplifier with hybrid frequency compensation is developed to further reduce the power consumption and maintain the ADC's performance simultaneously. The measured results imply that the ADC achieves a spurious-free dynamic range (SFDR) of 75.7 dB and a signal-to-noise-plus-distortion ratio (SNDR) of 62.74 dB with a 4.3 MHz input signal; the SNDR maintains over 58.25 dB for input signals up to 19.3MHz. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are -0.43 to +0.48 LSB and -1.62 to +1.89 LSB respectively. The prototype ADC consumes 28.4 mW under a 1.2-V nominal power supply and 40 MHz sampling rate, transferring to a figure-of-merit (FOM) of 0.63 pJ per conversion-step.

  17. Low Temperature Testing of a Radiation Hardened CMOS 8-Bit Flash Analog-to-Digital (A/D) Converter

    NASA Technical Reports Server (NTRS)

    Gerber, Scott S.; Hammond, Ahmad; Elbuluk, Malik E.; Patterson, Richard L.; Overton, Eric; Ghaffarian, Reza; Ramesham, Rajeshuni; Agarwal, Shri G.

    2001-01-01

    Power processing electronic systems, data acquiring probes, and signal conditioning circuits are required to operate reliably under harsh environments in many of NASA:s missions. The environment of the space mission as well as the operational requirements of some of the electronic systems, such as infrared-based satellite or telescopic observation stations where cryogenics are involved, dictate the utilization of electronics that can operate efficiently and reliably at low temperatures. In this work, radiation-hard CMOS 8-bit flash A/D converters were characterized in terms of voltage conversion and offset in the temperature range of +25 to -190 C. Static and dynamic supply currents, ladder resistance, and gain and offset errors were also obtained in the temperature range of +125 to -190 C. The effect of thermal cycling on these properties for a total of ten cycles between +80 and - 150 C was also determined. The experimental procedure along with the data obtained are reported and discussed in this paper.

  18. Synchrotron based planar imaging and digital tomosynthesis of breast and biopsy phantoms using a CMOS active pixel sensor.

    PubMed

    Szafraniec, Magdalena B; Konstantinidis, Anastasios C; Tromba, Giuliana; Dreossi, Diego; Vecchio, Sara; Rigon, Luigi; Sodini, Nicola; Naday, Steve; Gunn, Spencer; McArthur, Alan; Olivo, Alessandro

    2015-03-01

    The SYRMEP (SYnchrotron Radiation for MEdical Physics) beamline at Elettra is performing the first mammography study on human patients using free-space propagation phase contrast imaging. The stricter spatial resolution requirements of this method currently force the use of conventional films or specialized computed radiography (CR) systems. This also prevents the implementation of three-dimensional (3D) approaches. This paper explores the use of an X-ray detector based on complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology as a possible alternative, for acquisitions both in planar and tomosynthesis geometry. Results indicate higher quality of the images acquired with the synchrotron set-up in both geometries. This improvement can be partly ascribed to the use of parallel, collimated and monochromatic synchrotron radiation (resulting in scatter rejection, no penumbra-induced blurring and optimized X-ray energy), and partly to phase contrast effects. Even though the pixel size of the used detector is still too large - and thus suboptimal - for free-space propagation phase contrast imaging, a degree of phase-induced edge enhancement can clearly be observed in the images. PMID:25498332

  19. Digital-pixel focal plane array development

    NASA Astrophysics Data System (ADS)

    Brown, Matthew G.; Baker, Justin; Colonero, Curtis; Costa, Joe; Gardner, Tom; Kelly, Mike; Schultz, Ken; Tyrrell, Brian; Wey, Jim

    2010-01-01

    Since 2006, MIT Lincoln Laboratory has been developing Digital-pixel Focal Plane Array (DFPA) readout integrated circuits (ROICs). To date, four 256 × 256 30 μm pitch DFPA designs with in-pixel analog to digital conversion have been fabricated using IBM 90 nm CMOS processes. The DFPA ROICs are compatible with a wide range of detector materials and cutoff wavelengths; HgCdTe, QWIP, and InGaAs photo-detectors with cutoff wavelengths ranging from 1.6 to 14.5 μm have been hybridized to the same digital-pixel readout. The digital-pixel readout architecture offers high dynamic range, A/C or D/C coupled integration, and on-chip image processing with low power orthogonal transfer operations. The newest ROIC designs support two-color operation with a single Indium bump connection. Development and characterization of the two-color DFPA designs is presented along with applications for this new digital readout technology.

  20. Improved Programming Efficiency through Additional Boron Implantation at the Active Area Edge in 90 nm Localized Charge-Trapping Non-volatile Memory

    NASA Astrophysics Data System (ADS)

    Xu, Yue; Yan, Feng; Chen, Dun-Jun; Shi, Yi; Wang, Yong-Gang; Li, Zhi-Guo; Yang, Fan; Wang, Jos-Hua; Lin, Peter; Chang, Jian-Guang

    2010-06-01

    As the scaling-down of non-volatile memory (NVM) cells continues, the impact of shallow trench isolation (STI) on NVM cells becomes more severe. It has been observed in the 90 nm localized charge-trapping non-volatile memory (NROM™) that the programming efficiency of edge cells adjacent to STI is remarkably lower than that of other cells when channel hot electron injection is applied. Boron segregation is found to be mainly responsible for the low programming efficiency of edge cells. Meanwhile, an additional boron implantation of 10° tilt at the active area edge as a new solution to solve this problem is developed.

  1. Advanced mask technique to improve bit line CD uniformity of 90 nm node flash memory in low-k1 lithography

    NASA Astrophysics Data System (ADS)

    Kim, Jong-doo; Choi, Jae-young; Kim, Jea-hee; Han, Jae-won

    2008-10-01

    As devices size move toward 90nm technology node or below, defining uniform bit line CD of flash devices is one of the most challenging features to print in KrF lithography. There are two principal difficulties in defining bit line on wafer. One is insufficient process margin besides poor resolution compared with ArF lithography. The other is that asymmetric bit line should be made for OPC(Optical Proximity Correction) modeling. Therefore advanced ArF lithography scanner should be used for define bit line with RETs (Resolution Enhancement Techniques) such as immersion lithography, OPC, PSM(Phase Shift Mask), high NA(Numerical Aperture), OAI(Off-Axis Illumination), SRAF(Sub-resolution Assistant Feature), and mask biasing.. Like this, ArF lithography propose the method of enhancing resolution, however, we must spend an enormous amount of CoC(cost of ownership) to utilize ArF photolithography process than KrF. In this paper, we suggest method to improve of bit line CD uniformity, patterned by KrF lithographic process in 90nm sFlash(stand alone Flash) devices. We applied new scheme of mask manufacturing, which is able to realize 2 different types of mask, binary and phase-shift, into one plate. Finally, we could get the more uniform bit lines and we expect to get more stable properties then before applying this technique.

  2. Large area CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Turchetta, R.; Guerrini, N.; Sedgwick, I.

    2011-01-01

    CMOS image sensors, also known as CMOS Active Pixel Sensors (APS) or Monolithic Active Pixel Sensors (MAPS), are today the dominant imaging devices. They are omnipresent in our daily life, as image sensors in cellular phones, web cams, digital cameras, ... In these applications, the pixels can be very small, in the micron range, and the sensors themselves tend to be limited in size. However, many scientific applications, like particle or X-ray detection, require large format, often with large pixels, as well as other specific performance, like low noise, radiation hardness or very fast readout. The sensors are also required to be sensitive to a broad spectrum of radiation: photons from the silicon cut-off in the IR down to UV and X- and gamma-rays through the visible spectrum as well as charged particles. This requirement calls for modifications to the substrate to be introduced to provide optimized sensitivity. This paper will review existing CMOS image sensors, whose size can be as large as a single CMOS wafer, and analyse the technical requirements and specific challenges of large format CMOS image sensors.

  3. Design of a 10-bit segmented current-steering digital-to-analog converter in CMOS 65 nm technology for the bias of new generation readout chips in high radiation environment

    NASA Astrophysics Data System (ADS)

    De Robertis, G.; Loddo, F.; Mattiazzo, S.; Pacher, L.; Pantano, D.; Tamma, C.

    2016-01-01

    A new pixel front end chip for HL-LHC experiments in CMOS 65nm technology is under development by the CERN RD53 collaboration together with the Chipix65 INFN project. This work describes the design of a 10-bit segmented current-steering Digital-to-Analog Converter (DAC) to provide a programmable bias current to the analog blocks of the circuit. The main requirements are monotonicity, good linearity, limited area consumption and radiation hardness up to 10 MGy. The DAC was prototyped and electrically tested, while irradiation tests will be performed in Autumn 2015.

  4. Optical hybrid package with an 8-channel 18GT/s CMOS transceiver for chip-to-chip optical interconnect

    NASA Astrophysics Data System (ADS)

    Mohammed, E.; Liao, J.; Kern, A.; Lu, D.; Braunisch, H.; Thomas, T.; Hyvonen, S.; Palermo, S.; Young, I. A.

    2008-02-01

    We describe the design and development of a high-speed 8-channel hybrid integrated optical transceiver package with Clock and Data Recovery (CDR) circuits. The package concept has been developed to be compatible with microprocessor package technology and at the same time allow the integration of low cost, high-performance optical components. A 90nm CMOS optical transceiver chip, 850nm 10Gb/s GaAs based vertical cavity surface emitting laser (VCSEL) array and PIN photodiode array are flip-chip mounted on a standard microprocessor Land Grid Array (LGA) package substrate. The CMOS drivers and receivers on the transceiver chip and the optical components (VCSEL and Photodiode arrays) are electrically coupled using a short transmission line routed on the top surface of the package. VCSEL and photodiode arrays are optically coupled to on-package integrated polymer waveguide arrays with metallized 45° mirrors. The waveguides, which are terminated with multi-terminal (MT) fiber optic connectors, couple out/in high-speed optical signals to/from the chip. The CMOS transceiver chip fully integrates all analog optical circuits such as VCSEL drivers, transimpedance amplifiers and clock and data recovery (CDR) retiming circuit with a low jitter LC-PLL. Digital circuits for pseudorandom bit-pattern sequence generators (PRBS) and bit-error rate test (BERT) are fully integrated. 20Gb/s electrical and 18Gb/s optical eye diagrams for the transmitter were measured out of the package. A fully packaged transmitter and receiver including clock data recovery at 10Gb/s have also been measured.

  5. Yb:CaGdAlO4 thin-disk laser with 70% slope efficiency and 90 nm wavelength tuning range.

    PubMed

    Beil, Kolja; Deppe, Bastian; Kränkel, Christian

    2013-06-01

    Thin-disk laser experiments with Yb:CaGdAlO(4) (Yb:CALGO) have been performed. A slope efficiency of 70% and an optical-to-optical efficiency of 57% could be achieved with a maximum output power of 30.7 W. These are so far the highest efficiencies obtained with this material. Furthermore, tuning experiments were carried out leading to a tuning range of 90 nm in total and 50 nm with more than 20 W of output power. This is to the best of our knowledge the widest wavelength tuning range of any material demonstrated at this power level. For all experiments the thermal evolution of the crystal surface temperature during laser operation was investigated. PMID:23722805

  6. CMOS output buffer wave shaper

    NASA Technical Reports Server (NTRS)

    Albertson, L.; Whitaker, S.; Merrell, R.

    1990-01-01

    As the switching speeds and densities of Digital CMOS integrated circuits continue to increase, output switching noise becomes more of a problem. A design technique which aids in the reduction of switching noise is reported. The output driver stage is analyzed through the use of an equivalent RLC circuit. The results of the analysis are used in the design of an output driver stage. A test circuit based on these techniques is being submitted to MOSIS for fabrication.

  7. Cryogenic measurements of a digital pixel readout integrated circuit for LWIR

    NASA Astrophysics Data System (ADS)

    Shafique, Atia; Yazici, Melik; Kayahan, Huseyin; Ceylan, Omer; Gurbuz, Yasar

    2015-06-01

    This paper presents and discusses the cryogenic temperature (77K) measurement results of a digital readout integrated circuit (DROIC) for a 32x32 long wavelength infrared pixel sensor array designed in 90nm CMOS process. The chip achieves a signal-to-noise ratio (SNR) of 58dB with a charge handling capacity of 2.03Ge- at cryogenic temperature with 1.3mW of power dissipation. The performance of the readout is discussed in terms of power dissipation, charge handling capacity and SNR considering the fact that the process library models are not optimized for cryogenic temperature operation of the Metal-Oxide-Semiconductor (MOS) devices. These results provide an insight to foresee the design confrontations due to non-optimized device models for cryogenic temperatures particularly for short channel devices

  8. Digital spatial wavelength domain multiplexing (DSWDM) using a prism-grating-prism (PGP) and a CMOS imager: implementation and initial testing

    NASA Astrophysics Data System (ADS)

    Christiansen, Martin B.; Chen, Steve; Baldwin, Christopher S.; Niemczuk, John B.; Kiddy, Jason S.; Chen, Peter C.; Kopola, Harri K.; Aikio, Mauri; Suopajarvi, Pekka; Buckley, Steven G.

    2001-08-01

    A CMOS imager-based spectrometer is used to interrogate a network containing a large number of Bragg grating sensors on multiple fibers as part of a proprietary structural health monitoring system. The spectrometer uses a Prism-Grating-Prism (PGP) to spectrally separate serially multiplexed Bragg reflections on a single fiber. As a result, each Bragg grating produces a discrete spot on the CMOS imager that shifts horizontally as the Bragg grating experiences changes in strain or temperature. The reflected wavelength of the Bragg grating can be determined by finding the center of the spot produced. The use of a random addressing CMOS imager enables a flexible sampling rate. Some fibers can be interrogated at a high sampling rate while others can be interrogated at a lower sampling rate. However, the use of a CMOS camera brings several specific problems in terms of signal processing. These include a logarithmic pixel response, a low signal-to-noise ratio, the long pixel time constant, obtaining sufficient process priority for the control program, and proper selection of the window of interest. In this paper we investigate computer algorithms and hardware solutions to address these problems. We also present experimental data to validate these solutions including calibration data and initial field-testing data with 24 sensors on 4 fibers.

  9. High responsivity CMOS imager pixel implemented in SOI technology

    NASA Technical Reports Server (NTRS)

    Zheng, X.; Wrigley, C.; Yang, G.; Pain, B.

    2000-01-01

    Availability of mature sub-micron CMOS technology and the advent of the new low noise active pixel sensor (APS) concept have enabled the development of low power, miniature, single-chip, CMOS digital imagers in the decade of the 1990's.

  10. A novel colour-sensitive CMOS detector

    NASA Astrophysics Data System (ADS)

    Langfelder, G.; Longoni, A.; Zaraga, F.

    2009-10-01

    A novel colour-sensitive semiconductor detector is proposed. The device (named Transverse Field Detector (TFD)) can be used to measure the colour of the incident light without any colour filter. The device is completely compatible with standard CMOS processes and is suitable to be integrated in a pixel array for imaging purposes. The working principle is based on the capability of this device to collect at different superficial junctions the carriers, generated at different depths, by means of suitable transverse electric fields. The transverse components of the electric field are generated inside the depleted region by a suitable bias of the superficial junctions. Thanks to the differences in the light absorption coefficients at different wavelengths, the device performs colour separation. Among the advantages of this approach are the capability of an active tuning of the pixel colour response, which can be obtained just by changing the biasing values of collecting junctions, and foreseen higher colour fidelity, thanks to the easy extension to four colour pixels. First test structures of three colours TFD pixels were designed and built in a standard CMOS 90 nm technology. Operative principles of the device and first experimental results are presented.

  11. A scalable neural chip with synaptic electronics using CMOS integrated memristors

    NASA Astrophysics Data System (ADS)

    Cruz-Albrecht, Jose M.; Derosier, Timothy; Srinivasa, Narayan

    2013-09-01

    The design and simulation of a scalable neural chip with synaptic electronics using nanoscale memristors fully integrated with complementary metal-oxide-semiconductor (CMOS) is presented. The circuit consists of integrate-and-fire neurons and synapses with spike-timing dependent plasticity (STDP). The synaptic conductance values can be stored in memristors with eight levels, and the topology of connections between neurons is reconfigurable. The circuit has been designed using a 90 nm CMOS process with via connections to on-chip post-processed memristor arrays. The design has about 16 million CMOS transistors and 73 728 integrated memristors. We provide circuit level simulations of the entire chip performing neuronal and synaptic computations that result in biologically realistic functional behavior.

  12. Low area 4-bit 5 MS/s flash-type digitizer for hybrid-pixel detectors - Design study in 180 nm and 40 nm CMOS

    NASA Astrophysics Data System (ADS)

    Otfinowski, Piotr; Grybos, Pawel

    2015-11-01

    We report on the design of a 4-bit flash ADC with dynamic offset correction dedicated to measurement systems based on a pixel architecture. The presented converter was manufactured in two CMOS technologies: widespread and economical 180 nm and modern 40 nm process. The designs are optimized for the lowest area occupancy resulting in chip areas of 160×55 μm2 and 35×25 μm2. The experimental results indicate integral nonlinearity of +0.35/-0.21 LSB and +0.28/-0.25 LSB and power consumption of 52 μW and 17 μW at 5 MS/s for the prototypes in 180 nm and 40 nm technologies respectively.

  13. Monolithic integration of high bandwidth waveguide coupled Ge photodiode in a photonic BiCMOS process

    NASA Astrophysics Data System (ADS)

    Lischke, S.; Knoll, D.; Zimmermann, L.

    2015-03-01

    Monolithic integration of photonic functionality in the frontend-of-line (FEOL) of an advanced microelectronics technology is a key step towards future communication applications. This combines photonic components such as waveguides, couplers, modulators, and photo detectors with high-speed electronics plus shortest possible interconnects crucial for high-speed performance. Integration of photonics into CMOS FEOL is therefore in development for quite some time reaching 90nm node recently [1]. However, an alternative to CMOS is high-performance BiCMOS, offering significant advantages for integrated photonics-electronics applications with regard to cost and RF performance. We already presented results of FEOL integration of photonic components in a high-performance SiGe:C BiCMOS baseline to establish a novel, photonic BiCMOS process. Process cornerstone is a local-SOI approach which allows us to fabricate SOI-based, thus low-loss photonic components in a bulk BiCMOS environment [2]. A monolithically integrated 10Gbit/sec Silicon modulator with driver was shown here [3]. A monolithically integrated 25Gbps receiver was presented in [4], consisting of 200GHz bipolar transistors and CMOS devices, low-loss waveguides, couplers, and highspeed Ge photo diodes showing 3-dB bandwidth of 35GHz, internal responsivity of more than 0.6A/W at λ= 1.55μm, and ~ 50nA dark current at 1V. However, the BiCMOS-given thermal steps cause a significant smearing of the Germanium photo diodes doping profile, limiting the photo diode performance. Therefore, we introduced implantation of non-doping elements to overcome such limiting factors, resulting in photo diode bandwidths of more than 50GHz even under the effect of thermal steps necessary when the diodes are integrated in a high performance BiCMOS process.

  14. A safety monitoring system for taxi based on CMOS imager

    NASA Astrophysics Data System (ADS)

    Liu, Zhi

    2005-01-01

    CMOS image sensors now become increasingly competitive with respect to their CCD counterparts, while adding advantages such as no blooming, simpler driving requirements and the potential of on-chip integration of sensor, analogue circuitry, and digital processing functions. A safety monitoring system for taxi based on cmos imager that can record field situation when unusual circumstance happened is described in this paper. The monitoring system is based on a CMOS imager (OV7120), which can output digital image data through parallel pixel data port. The system consists of a CMOS image sensor, a large capacity NAND FLASH ROM, a USB interface chip and a micro controller (AT90S8515). The structure of whole system and the test data is discussed and analyzed in detail.

  15. Ink-Jet Printed CMOS Electronics from Oxide Semiconductors.

    PubMed

    Garlapati, Suresh Kumar; Baby, Tessy Theres; Dehm, Simone; Hammad, Mohammed; Chakravadhanula, Venkata Sai Kiran; Kruk, Robert; Hahn, Horst; Dasgupta, Subho

    2015-08-01

    Complementary metal oxide semiconductor (CMOS) technology with high transconductance and signal gain is mandatory for practicable digital/analog logic electronics. However, high performance all-oxide CMOS logics are scarcely reported in the literature; specifically, not at all for solution-processed/printed transistors. As a major step toward solution-processed all-oxide electronics, here it is shown that using a highly efficient electrolyte-gating approach one can obtain printed and low-voltage operated oxide CMOS logics with high signal gain (≈21 at a supply voltage of only 1.5 V) and low static power dissipation. PMID:25867029

  16. CMOS Image Sensors: Electronic Camera On A Chip

    NASA Technical Reports Server (NTRS)

    Fossum, E. R.

    1995-01-01

    Recent advancements in CMOS image sensor technology are reviewed, including both passive pixel sensors and active pixel sensors. On- chip analog to digital converters and on-chip timing and control circuits permit realization of an electronic camera-on-a-chip. Highly miniaturized imaging systems based on CMOS image sensor technology are emerging as a competitor to charge-coupled devices for low cost uses.

  17. A CMOS high speed imaging system design based on FPGA

    NASA Astrophysics Data System (ADS)

    Tang, Hong; Wang, Huawei; Cao, Jianzhong; Qiao, Mingrui

    2015-10-01

    CMOS sensors have more advantages than traditional CCD sensors. The imaging system based on CMOS has become a hot spot in research and development. In order to achieve the real-time data acquisition and high-speed transmission, we design a high-speed CMOS imaging system on account of FPGA. The core control chip of this system is XC6SL75T and we take advantages of CameraLink interface and AM41V4 CMOS image sensors to transmit and acquire image data. AM41V4 is a 4 Megapixel High speed 500 frames per second CMOS image sensor with global shutter and 4/3" optical format. The sensor uses column parallel A/D converters to digitize the images. The CameraLink interface adopts DS90CR287 and it can convert 28 bits of LVCMOS/LVTTL data into four LVDS data stream. The reflected light of objects is photographed by the CMOS detectors. CMOS sensors convert the light to electronic signals and then send them to FPGA. FPGA processes data it received and transmits them to upper computer which has acquisition cards through CameraLink interface configured as full models. Then PC will store, visualize and process images later. The structure and principle of the system are both explained in this paper and this paper introduces the hardware and software design of the system. FPGA introduces the driven clock of CMOS. The data in CMOS is converted to LVDS signals and then transmitted to the data acquisition cards. After simulation, the paper presents a row transfer timing sequence of CMOS. The system realized real-time image acquisition and external controls.

  18. A low-power inverter-based CMOS level-crossing analog-to-digital converter for low-frequency biosignal sensing

    NASA Astrophysics Data System (ADS)

    Tanaka, Suiki; Niitsu, Kiichi; Nakazato, Kazuo

    2016-03-01

    Low-power analog-to-digital conversion is a key technique for power-limited biomedical applications such as power-limited continuous glucose monitoring. However, a conventional uniform-sampling analog-to-digital converter (ADC) is not suitable for nonuniform biosignals. A level-crossing ADC (LC-ADC) is a promising candidate for low-power biosignal processing because of its event-driven properties. The LC-ADC acquires data by level-crossing sampling. When an input signal crosses the threshold level, the LC-ADC samples the signal. The conventional LC-ADC employs a power-hungry comparator. In this paper, we present a low-power inverter-based LC-ADC. By adjusting the threshold level of the inverter, it can be used as a threshold-fixed window comparator. By using the inverter as an alternative to a comparator, power consumption can be markedly reduced. As a result, the total power consumption is successfully reduced by 90% of that of previous LC-ADC. The inverter-based LC-ADC was found to be very suitable for use in power-limited biomedical devices.

  19. All-CMOS night vision viewer with integrated microdisplay

    NASA Astrophysics Data System (ADS)

    Goosen, Marius E.; Venter, Petrus J.; du Plessis, Monuko; Faure, Nicolaas M.; Janse van Rensburg, Christo; Rademeyer, Pieter

    2014-02-01

    The unrivalled integration potential of CMOS has made it the dominant technology for digital integrated circuits. With the advent of visible light emission from silicon through hot carrier electroluminescence, several applications arose, all of which rely upon the advantages of mature CMOS technologies for a competitive edge in a very active and attractive market. In this paper we present a low-cost night vision viewer which employs only standard CMOS technologies. A commercial CMOS imager is utilized for near infrared image capturing with a 128x96 pixel all-CMOS microdisplay implemented to convey the image to the user. The display is implemented in a standard 0.35 μm CMOS process, with no process alterations or post processing. The display features a 25 μm pixel pitch and a 3.2 mm x 2.4 mm active area, which through magnification presents the virtual image to the user equivalent of a 19-inch display viewed from a distance of 3 meters. This work represents the first application of a CMOS microdisplay in a low-cost consumer product.

  20. Tests of commercial colour CMOS cameras for astronomical applications

    NASA Astrophysics Data System (ADS)

    Pokhvala, S. M.; Reshetnyk, V. M.; Zhilyaev, B. E.

    2013-12-01

    We present some results of testing commercial colour CMOS cameras for astronomical applications. Colour CMOS sensors allow to perform photometry in three filters simultaneously that gives a great advantage compared with monochrome CCD detectors. The Bayer BGR colour system realized in colour CMOS sensors is close to the astronomical Johnson BVR system. The basic camera characteristics: read noise (e^{-}/pix), thermal noise (e^{-}/pix/sec) and electronic gain (e^{-}/ADU) for the commercial digital camera Canon 5D MarkIII are presented. We give the same characteristics for the scientific high performance cooled CCD camera system ALTA E47. Comparing results for tests of Canon 5D MarkIII and CCD ALTA E47 show that present-day commercial colour CMOS cameras can seriously compete with the scientific CCD cameras in deep astronomical imaging.

  1. High-speed multicolour photometry with CMOS cameras

    NASA Astrophysics Data System (ADS)

    Pokhvala, S. M.; Zhilyaev, B. E.; Reshetnyk, V. M.

    2012-11-01

    We present the results of testing the commercial digital camera Nikon D90 with a CMOS sensor for high-speed photometry with a small telescope Celestron 11'' at the Peak Terskol Observatory. CMOS sensor allows to perform photometry in 3 filters simultaneously that gives a great advantage compared with monochrome CCD detectors. The Bayer BGR colour system of CMOS sensors is close to the Johnson BVR system. The results of testing show that one can carry out photometric measurements with CMOS cameras for stars with the V-magnitude up to ≃14^{m} with the precision of 0.01^{m}. Stars with the V-magnitude up to ˜10 can be shot at 24 frames per second in the video mode.

  2. CMOS-controlled rapidly tunable photodetectors

    NASA Astrophysics Data System (ADS)

    Chen, Ray

    With rapidly increasing data bandwidth demands, wavelength-division-multiplexing (WDM) optical access networks seem unavoidable in the near future. To operate WDM optical networks in an efficient scheme, wavelength reconfigurability and scalability of the network are crucial. Unfortunately, most of the existing wavelength tunable technologies are neither rapidly tunable nor spectrally programmable. This dissertation presents a tunable photodetector that is designed for dynamic-wavelength allocation WDM network environments. The wavelength tuning mechanism is completely different from existing technologies. The spectrum of this detector is programmable through low-voltage digital patterns. Since the wavelength selection is achieved by electronic means, the device wavelength reconfiguration time is as fast as the electronic switching time. In this dissertation work, we have demonstrated a tunable detector that is hybridly integrated with its customized CMOS driver and receiver with nanosecond wavelength reconfiguration time. In addition to its nanosecond wavelength reconfiguration time, the spectrum of this detector is digitally programmable, which means that it can adapt to system changes without re-fabrication. We have theoretically developed and experimentally demonstrated two device operating algorithms based on the same orthogonal device-optics basis. Both the rapid wavelength tuning time and the scalability make this novel device very viable for new reconfigurable WDM networks. By taking advantage of CMOS circuit design, this detector concept can be further extended for simultaneous multiple wavelength detection. We have developed one possible chip architecture and have designed a CMOS tunable optical demux for simultaneous controllable two-wavelength detection.

  3. DFM in practice: results of a three way partnership between a leading fabless design house, foundry, and EDA company to implement alternating-phase shift mask (Alt-PSM) on a 90-nm FPGA chip

    NASA Astrophysics Data System (ADS)

    Yu, Chun-Chi; Shieh, Ming-Feng; Liu, Erick; Lin, Benjamin; Lin, Henry; Chacko, Manoj; Li, Xiaoyang; Lei, Wen-Kang; Ho, Jonathan; Wu, Xin

    2005-05-01

    At the sub 90nm nodes, resolution enhancement techniques (RETs) such as optical proximity correction (OPC), phase-shifting masks (PSM), sub-resolution assist features (SRAF) have become essential steps in the post-physical verification 'Mask Synthesis' process and a key component of design for manufacturing (DFM). Several studies have been conducted and the results have been published on the implication and application of the different types of RETs on mask printability and costs. More specifically, double-exposure-based, dark-field, alternating PSM (Alt-PSM) technology has received lot of attention with respect to the mask manufacturing challenges and its implementation into a production flow, despite its yield and critical dimension (CD) control superiority. Implementation of Alt-PSM generally requires phase compliance rules and proper phase topology in the layout and this has been successful for the technology node with these rules implemented. However, this may not be true for a matured, production process technology, in this case 90 nm. Especially, in the foundry-fabless business model where the foundry provides a standard set of design rules to its customers for a given process technology, and where not all the foundry customers require Alt-PSM in their tapeout flow. What follows is an in-depth review of the DFM challenges to each partner faced, its effect on the tapeout flow, and how design, manufacturing, and EDA teams worked together to resolve phase conflicts, tapeout the chip, and finally verify the silicon results in production.

  4. Further developments on a novel color sensitive CMOS detector

    NASA Astrophysics Data System (ADS)

    Langfelder, G.; Longoni, A.; Zaraga, F.

    2009-05-01

    The Transverse Field Detector (TFD) is a recently proposed Silicon pixel device designed to perform color imaging without the use of color filters. The color detection principle is based on the dependence of the Silicon absorption coefficient from the wavelength and relies on the generation of a suitable transverse electric field configuration, within the semiconductor active layer, to drive photocarriers generated at different depths towards different collecting electrodes. Each electrode has in this way a different spectral response with respect to the incoming wavelength. Pixels with three or four different spectral responses can be implemented within ~ 6 μm of pixel dimension. Thanks to the compatibility with standard triple well CMOS processes, the TFD can be used in an Active Pixel Sensor exploiting a dedicated readout topology, based on a single transistor charge amplifier. The overall APS electronics includes five transistors (5T) and a feedback capacitance, with a resulting overall fill factor around 50%. In this work the three colors and four colors TFD pixel simulations and implementations in a 90 nm standard CMOS triple well technology are described. Details on the design of a TFD APS mini matrix are provided and preliminary experimental results on four colors pixels are presented.

  5. Implantable CMOS Biomedical Devices

    PubMed Central

    Ohta, Jun; Tokuda, Takashi; Sasagawa, Kiyotaka; Noda, Toshihiko

    2009-01-01

    The results of recent research on our implantable CMOS biomedical devices are reviewed. Topics include retinal prosthesis devices and deep-brain implantation devices for small animals. Fundamental device structures and characteristics as well as in vivo experiments are presented. PMID:22291554

  6. Low light level CMOS sensor for night vision systems

    NASA Astrophysics Data System (ADS)

    Gross, Elad; Ginat, Ran; Nesher, Ofer

    2015-05-01

    For many years image intensifier tubes were used for night vision systems. In 2014, Elbit systems developed a digital low-light level CMOS sensor, with similar sensitivity to a Gen II image-intensifiers, down to starlight conditions. In this work we describe: the basic principle behind this sensor, physical model for low-light performance estimation and results of field testing.

  7. Integrated imaging sensor systems with CMOS active pixel sensor technology

    NASA Technical Reports Server (NTRS)

    Yang, G.; Cunningham, T.; Ortiz, M.; Heynssens, J.; Sun, C.; Hancock, B.; Seshadri, S.; Wrigley, C.; McCarty, K.; Pain, B.

    2002-01-01

    This paper discusses common approaches to CMOS APS technology, as well as specific results on the five-wire programmable digital camera-on-a-chip developed at JPL. The paper also reports recent research in the design, operation, and performance of APS imagers for several imager applications.

  8. CMOS Imaging Sensor Technology for Aerial Mapping Cameras

    NASA Astrophysics Data System (ADS)

    Neumann, Klaus; Welzenbach, Martin; Timm, Martin

    2016-06-01

    In June 2015 Leica Geosystems launched the first large format aerial mapping camera using CMOS sensor technology, the Leica DMC III. This paper describes the motivation to change from CCD sensor technology to CMOS for the development of this new aerial mapping camera. In 2002 the DMC first generation was developed by Z/I Imaging. It was the first large format digital frame sensor designed for mapping applications. In 2009 Z/I Imaging designed the DMC II which was the first digital aerial mapping camera using a single ultra large CCD sensor to avoid stitching of smaller CCDs. The DMC III is now the third generation of large format frame sensor developed by Z/I Imaging and Leica Geosystems for the DMC camera family. It is an evolution of the DMC II using the same system design with one large monolithic PAN sensor and four multi spectral camera heads for R,G, B and NIR. For the first time a 391 Megapixel large CMOS sensor had been used as PAN chromatic sensor, which is an industry record. Along with CMOS technology goes a range of technical benefits. The dynamic range of the CMOS sensor is approx. twice the range of a comparable CCD sensor and the signal to noise ratio is significantly better than with CCDs. Finally results from the first DMC III customer installations and test flights will be presented and compared with other CCD based aerial sensors.

  9. On noise in time-delay integration CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Levski, Deyan; Choubey, Bhaskar

    2016-05-01

    Time delay integration sensors are of increasing interest in CMOS processes owing to their low cost, power and ability to integrate with other circuit readout blocks. This paper presents an analysis of the noise contributors in current day CMOS Time-Delay-Integration image sensors with various readout architectures. An analysis of charge versus voltage domain readout modes is presented, followed by a noise classification of the existing Analog Accumulator Readout (AAR) and Digital Accumulator Readout (DAR) schemes for TDI imaging. The analysis and classification of existing readout schemes include, pipelined charge transfer, buffered direct injection, voltage as well as current-mode analog accumulators and all-digital accumulator techniques. Time-Delay-Integration imaging modes in CMOS processes typically use an N-number of readout steps, equivalent to the number of TDI pixel stages. In CMOS TDI sensors, where voltage domain readout is used, the requirements over speed and noise of the ADC readout chain are increased due to accumulation of the dominant voltage readout and ADC noise with every stage N. Until this day, the latter is the primary reason for a leap-back of CMOS TDI sensors as compared to their CCD counterparts. Moreover, most commercial CMOS TDI implementations are still based on a charge-domain readout, mimicking a CCD-like operation mode. Thus, having a good understanding of each noise contributor in the signal chain, as well as its magnitude in different readout architectures, is vital for the design of future generation low-noise CMOS TDI image sensors based on a voltage domain readout. This paper gives a quantitative classification of all major noise sources for all popular implementations in the literature.

  10. CCD and CMOS sensors

    NASA Astrophysics Data System (ADS)

    Waltham, Nick

    The charge-coupled device (CCD) has been developed primarily as a compact image sensor for consumer and industrial markets, but is now also the preeminent visible and ultraviolet wavelength image sensor in many fields of scientific research including space-science and both Earth and planetary remote sensing. Today"s scientific or science-grade CCD will strive to maximise pixel count, focal plane coverage, photon detection efficiency over the broadest spectral range and signal dynamic range whilst maintaining the lowest possible readout noise. The relatively recent emergence of complementary metal oxide semiconductor (CMOS) image sensor technology is arguably the most important development in solid-state imaging since the invention of the CCD. CMOS technology enables the integration on a single silicon chip of a large array of photodiode pixels alongside all of the ancillary electronics needed to address the array and digitise the resulting analogue video signal. Compared to the CCD, CMOS promises a more compact, lower mass, lower power and potentially more radiation tolerant camera.

  11. A new digital readout integrated circuit (DROIC) with pixel parallel A/D conversion with reduced quantization noise

    NASA Astrophysics Data System (ADS)

    Kayahan, Huseyin; Ceylan, Ömer; Yazici, Melik; Gurbuz, Yasar

    2014-06-01

    This paper presents a digital ROIC for staring type arrays with extending counting method to realize very low quantization noise while achieving a very high charge handling capacity. Current state of the art has shown that digital readouts with pulse frequency method can achieve charge handling capacities higher than 3Ge- with quantization noise higher than 1000e-. Even if the integration capacitance is reduced, it cannot be lower than 1-3 fF due to the parasitic capacitance of the comparator. For achieving a very low quantization noise of 161 electrons in a power efficient way, a new method based on measuring the time to measure the remaining charge on the integration capacitor is proposed. With this approach SNR of low flux pixels are significantly increased while large flux pixels can store electrons as high as 2.33Ge-. A prototype array of 32×32 pixels with 30μm pitch is implemented in 90nm CMOS process technology for verification. Measurement results are given for complete readout.

  12. A CMOS Humidity Sensor for Passive RFID Sensing Applications

    PubMed Central

    Deng, Fangming; He, Yigang; Zhang, Chaolong; Feng, Wei

    2014-01-01

    This paper presents a low-cost low-power CMOS humidity sensor for passive RFID sensing applications. The humidity sensing element is implemented in standard CMOS technology without any further post-processing, which results in low fabrication costs. The interface of this humidity sensor employs a PLL-based architecture transferring sensor signal processing from the voltage domain to the frequency domain. Therefore this architecture allows the use of a fully digital circuit, which can operate on ultra-low supply voltage and thus achieves low-power consumption. The proposed humidity sensor has been fabricated in the TSMC 0.18 μm CMOS process. The measurements show this humidity sensor exhibits excellent linearity and stability within the relative humidity range. The sensor interface circuit consumes only 1.05 μW at 0.5 V supply voltage and reduces it at least by an order of magnitude compared to previous designs. PMID:24841250

  13. A CMOS humidity sensor for passive RFID sensing applications.

    PubMed

    Deng, Fangming; He, Yigang; Zhang, Chaolong; Feng, Wei

    2014-01-01

    This paper presents a low-cost low-power CMOS humidity sensor for passive RFID sensing applications. The humidity sensing element is implemented in standard CMOS technology without any further post-processing, which results in low fabrication costs. The interface of this humidity sensor employs a PLL-based architecture transferring sensor signal processing from the voltage domain to the frequency domain. Therefore this architecture allows the use of a fully digital circuit, which can operate on ultra-low supply voltage and thus achieves low-power consumption. The proposed humidity sensor has been fabricated in the TSMC 0.18 μm CMOS process. The measurements show this humidity sensor exhibits excellent linearity and stability within the relative humidity range. The sensor interface circuit consumes only 1.05 µW at 0.5 V supply voltage and reduces it at least by an order of magnitude compared to previous designs. PMID:24841250

  14. CMOS Monolithic Active Pixel Sensors (MAPS): Developments and future outlook

    NASA Astrophysics Data System (ADS)

    Turchetta, R.; Fant, A.; Gasiorek, P.; Esbrand, C.; Griffiths, J. A.; Metaxas, M. G.; Royle, G. J.; Speller, R.; Venanzi, C.; van der Stelt, P. F.; Verheij, H.; Li, G.; Theodoridis, S.; Georgiou, H.; Cavouras, D.; Hall, G.; Noy, M.; Jones, J.; Leaver, J.; Machin, D.; Greenwood, S.; Khaleeq, M.; Schulerud, H.; Østby, J. M.; Triantis, F.; Asimidis, A.; Bolanakis, D.; Manthos, N.; Longo, R.; Bergamaschi, A.

    2007-12-01

    Re-invented in the early 1990s, on both sides of the Atlantic, Monolithic Active Pixel Sensors (MAPS) in a CMOS technology are today the most sold solid-state imaging devices, overtaking the traditional technology of Charge-Coupled Devices (CCD). The slow uptake of CMOS MAPS started with low-end applications, for example web-cams, and is slowly pervading the high-end applications, for example in prosumer digital cameras. Higher specifications are required for scientific applications: very low noise, high speed, high dynamic range, large format and radiation hardness are some of these requirements. This paper will present a brief overview of the CMOS Image Sensor technology and of the requirements for scientific applications. As an example, a sensor for X-ray imaging will be presented. This sensor was developed within a European FP6 Consortium, intelligent imaging sensors (I-ImaS).

  15. IGBT scaling principle toward CMOS compatible wafer processes

    NASA Astrophysics Data System (ADS)

    Tanaka, Masahiro; Omura, Ichiro

    2013-02-01

    A scaling principle for trench gate IGBT is proposed. CMOS technology on large diameter wafer enables to produce various digital circuits with higher performance and lower cost. The transistor cell structure becomes laterally smaller and smaller and vertically shallower and shallower. In contrast, latest IGBTs have rather deeper trench structure to obtain lower on-state voltage drop and turn-off loss. In the aspect of the process uniformity and wafer warpage, manufacturing such structure in the CMOS factory is difficult. In this paper, we show the scaling principle toward shallower structure and better performance. The principle is theoretically explained by our previously proposed "Structure Oriented" analytical model. The principle represents a possibility of technology direction and roadmap for future IGBT for improving the device performance consistent with lower cost and high volume productivity with CMOS compatible large diameter wafer technologies.

  16. High-performance monolithic CMOS detectors for space applications

    NASA Astrophysics Data System (ADS)

    Saint-Pe, Olivier; Tulet, Michel; Davancens, Robert; Larnaudie, Franck; Vignon, Bruno; Magnan, Pierre; Farre, Jean A.; Corbiere, Franck; Martin-Gonthier, Philippe

    2001-12-01

    During the last 10 years, research about CMOS image sensors (also called APS - Active Pixel Sensors) has been intensively carried out, in order to offer an alternative to CCDs as image sensors. This is particularly the case for space applications as CMOS image sensors feature characteristics which are obviously of interest for flight hardware: parallel or semi-parallel architecture, on chip control and processing electronics, low power dissipation, high level of radiation tolerance... Many image sensor companies, institutes and laboratories have demonstrated the compatibility of CMOS image sensors with consumer applications: micro-cameras, video-conferencing, digital- still cameras. And recent designs have shown that APS is getting closer to the CCD in terms of performance level. However, he large majority of the existing products do not offer the specific features which are required for many space applications. ASTRIUM and SUPAERO/CIMI have decided to work together in view of developing CMOS image sensors dedicated to space business. After a brief presentation of the team organization for space image sensor design and production, the latest results of a high performances 512 X 512 pixels CMOS device characterization are presented with emphasis on the achieved electro-optical performance. Finally, the on going and short-term coming activities of the team are discussed.

  17. Design and Fabrication of Vertically-Integrated CMOS Image Sensors

    PubMed Central

    Skorka, Orit; Joseph, Dileepan

    2011-01-01

    Technologies to fabricate integrated circuits (IC) with 3D structures are an emerging trend in IC design. They are based on vertical stacking of active components to form heterogeneous microsystems. Electronic image sensors will benefit from these technologies because they allow increased pixel-level data processing and device optimization. This paper covers general principles in the design of vertically-integrated (VI) CMOS image sensors that are fabricated by flip-chip bonding. These sensors are composed of a CMOS die and a photodetector die. As a specific example, the paper presents a VI-CMOS image sensor that was designed at the University of Alberta, and fabricated with the help of CMC Microsystems and Micralyne Inc. To realize prototypes, CMOS dies with logarithmic active pixels were prepared in a commercial process, and photodetector dies with metal-semiconductor-metal devices were prepared in a custom process using hydrogenated amorphous silicon. The paper also describes a digital camera that was developed to test the prototype. In this camera, scenes captured by the image sensor are read using an FPGA board, and sent in real time to a PC over USB for data processing and display. Experimental results show that the VI-CMOS prototype has a higher dynamic range and a lower dark limit than conventional electronic image sensors. PMID:22163860

  18. Regenerative switching CMOS system

    DOEpatents

    Welch, J.D.

    1998-06-02

    Complementary Metal Oxide Semiconductor (CMOS) Schottky barrier Field Effect Transistor systems, which are a series combination of N and P-Channel MOSFETS, in which Source Schottky barrier junctions of the N and P-Channel Schottky barrier MOSFETS are electrically interconnected, (rather than the Drains as in conventional diffused junction CMOS), which Schottky barrier MOSFET system demonstrates Regenerative Inverting Switching Characteristics in use are disclosed. Both the N and P-Channel Schottky barrier MOSFET devices are unique in that they provide operational Drain Current vs. Drain to Source voltage as a function of Gate voltage only where the polarities of the Drain voltage and Gate voltage are opposite, referenced to the Source as a common terminal, and where the polarity of the voltage applied to the Gate is appropriate to cause Channel inversion. Experimentally derived results which demonstrate and verify the operation of N and P-Channel Schottky barrier MOSFETS actually fabricated on P and N-type Silicon respectively, by a common procedure using vacuum deposited Chromium as a Schottky barrier forming metal, are also provided. 14 figs.

  19. Regenerative switching CMOS system

    DOEpatents

    Welch, James D.

    1998-01-01

    Complementary Metal Oxide Semiconductor (CMOS) Schottky barrier Field Effect Transistor systems, which are a seriesed combination of N and P-Channel MOSFETS, in which Source Schottky barrier junctions of the N and P-Channel Schottky barrier MOSFETS are electically interconnected, (rather than the Drains as in conventional diffused junction CMOS), which Schottky barrier MOSFET system demonstrates Regenerative Inverting Switching Characteristics in use are disclosed. Both the N and P-Channel Schottky barrier MOSFET devices are unique in that they provide operational Drain Current vs. Drain to Source voltage as a function of Gate voltage only where the polarities of the Drain voltage and Gate voltage are opposite, referenced to the Source as a common terminal, and where the polarity of the voltage applied to the Gate is appropriate to cause Channel inversion. Experimentally derived results which demonstrate and verify the operation of N and P-Channel Schottky barrier MOSFETS actually fabricated on P and N-type Silicon respectively, by a common procedure using vacuum deposited Chromium as a Schottky barrier forming metal, are also provided.

  20. Current-mode CMOS hybrid image sensor

    NASA Astrophysics Data System (ADS)

    Benyhesan, Mohammad Kassim

    Digital imaging is growing rapidly making Complimentary Metal-Oxide-Semi conductor (CMOS) image sensor-based cameras indispensable in many modern life devices like cell phones, surveillance devices, personal computers, and tablets. For various purposes wireless portable image systems are widely deployed in many indoor and outdoor places such as hospitals, urban areas, streets, highways, forests, mountains, and towers. However, the increased demand on high-resolution image sensors and improved processing features is expected to increase the power consumption of the CMOS sensor-based camera systems. Increased power consumption translates into a reduced battery life-time. The increased power consumption might not be a problem if there is access to a nearby charging station. On the other hand, the problem arises if the image sensor is located in widely spread areas, unfavorable to human intervention, and difficult to reach. Given the limitation of energy sources available for wireless CMOS image sensor, an energy harvesting technique presents a viable solution to extend the sensor life-time. Energy can be harvested from the sun light or the artificial light surrounding the sensor itself. In this thesis, we propose a current-mode CMOS hybrid image sensor capable of energy harvesting and image capture. The proposed sensor is based on a hybrid pixel that can be programmed to perform the task of an image sensor and the task of a solar cell to harvest energy. The basic idea is to design a pixel that can be configured to exploit its internal photodiode to perform two functions: image sensing and energy harvesting. As a proof of concept a 40 x 40 array of hybrid pixels has been designed and fabricated in a standard 0.5 microm CMOS process. Measurement results show that up to 39 microW of power can be harvested from the array under 130 Klux condition with an energy efficiency of 220 nJ /pixel /frame. The proposed image sensor is a current-mode image sensor which has several

  1. Design of low-power hybrid digital pulse width modulator with piecewise calibration scheme

    NASA Astrophysics Data System (ADS)

    Zhen, Shaowei; Hou, Sijian; Gan, Wubing; Chen, Jingbo; Luo, Ping; Zhang, Bo

    2015-12-01

    A low-power hybrid digital pulse width modulator (DPWM) is proposed in the paper. Owing to the piecewise calibration scheme, the delay time of delay line is locked to target frequency. The delay line consists of two piecewise lines with different control codes. The delay time of each cell in one sub-delay-line is longer than the last significant bit (LSB) of DPWM, while the delay time of each cell in the other sub-delay-line is shorter than LSB. Optimum linearity is realised with minimum standard cells. Simulation results show that the differential nonlinearity and integral nonlinearity are improved from 5.1 to 0.4 and from 5 to 1.3, respectively. The DPWM is fully synthesised and fabricated in a 90-nm CMOS process. The proposed DPWM occupies a silicon area of 0.01 mm2, with 31.5 μw core power consumption. Experimental results are shown to demonstrate the 2-MHz, 10-bit resolution implementation. Pulse width histogram is firstly introduced to characterise the linearity of the DPWM.

  2. Heterogeneous integration of GaAs pHEMT and Si CMOS on the same chip

    NASA Astrophysics Data System (ADS)

    Li-Shu, Wu; Yan, Zhao; Hong-Chang, Shen; You-Tao, Zhang; Tang-Sheng, Chen

    2016-06-01

    In this work, we demonstrate the technology of wafer-scale transistor-level heterogeneous integration of GaAs pseudomorphic high electron mobility transistors (pHEMTs) and Si complementary metal–oxide semiconductor (CMOS) on the same Silicon substrate. GaAs pHEMTs are vertical stacked at the top of the Si CMOS wafer using a wafer bonding technique, and the best alignment accuracy of 5 μm is obtained. As a circuit example, a wide band GaAs digital controlled switch is fabricated, which features the technologies of a digital control circuit in Si CMOS and a switch circuit in GaAs pHEMT, 15% smaller than the area of normal GaAs and Si CMOS circuits.

  3. CMOS image sensors as an efficient platform for glucose monitoring.

    PubMed

    Devadhasan, Jasmine Pramila; Kim, Sanghyo; Choi, Cheol Soo

    2013-10-01

    Complementary metal oxide semiconductor (CMOS) image sensors have been used previously in the analysis of biological samples. In the present study, a CMOS image sensor was used to monitor the concentration of oxidized mouse plasma glucose (86-322 mg dL(-1)) based on photon count variation. Measurement of the concentration of oxidized glucose was dependent on changes in color intensity; color intensity increased with increasing glucose concentration. The high color density of glucose highly prevented photons from passing through the polydimethylsiloxane (PDMS) chip, which suggests that the photon count was altered by color intensity. Photons were detected by a photodiode in the CMOS image sensor and converted to digital numbers by an analog to digital converter (ADC). Additionally, UV-spectral analysis and time-dependent photon analysis proved the efficiency of the detection system. This simple, effective, and consistent method for glucose measurement shows that CMOS image sensors are efficient devices for monitoring glucose in point-of-care applications. PMID:23900281

  4. Automation of CMOS technology migration illustrated by RGB to YCrCb analogue converter

    NASA Astrophysics Data System (ADS)

    Naumowicz, M.; Melosik, M.; Katarzynski, P.; Handkiewicz, A.

    2013-09-01

    The paper illustrates a practical example of technology migration applied to the colour space converter realized in CMOS technology. The element has analogue excitation and response signals expressed in current mode. Such converter may be incorporated into an integrated vision sensor for preconditioning acquired image data. The idea of a computer software tool supporting the automated migration and design reuse is presented as the major contribution. The mentioned tools implement the Hooke-Jeeves direct search method for performing the multivariable optimization. Our purpose is to ensure transferring the circuit between usable fabrication technologies and preserving its functional properties. The colour space converter is treated as the case study for performance evaluation of the proposed tool in cooperation with HSPICE simulation software. The original CMOS technology files for Taiwan semiconductor (TSMC) plant were utilized for the research. The automated design migration from 180 nm into 90 nm resulted with obtaining compact IC layout characterized by a smaller area and lower power consumption. The paper is concluded with a brief summary that proves the usability of the proposed tool in designing CMOS cells dedicated for low power image processing.

  5. Attenuation of single event induced pulses in CMOS combinational logic

    SciTech Connect

    Baze, M.P.; Buchner, S.P.

    1997-12-01

    Results are presented of a study of SEU generated transient pulse attenuation in combinational logic structures built using common digital CMOS design practices. SPICE circuit analysis, heavy ion tests, and pulsed, focused laser simulations were used to examine the response characteristics of transient pulse behavior in long logic strings. Results show that while there is an observable effect, it cannot be generally assumed that attenuation will significantly reduce observed circuit bit error rates.

  6. A high speed CMOS A/D converter

    NASA Technical Reports Server (NTRS)

    Wiseman, Don R.; Whitaker, Sterling R.

    1992-01-01

    This paper presents a high speed analog-to-digital (A/D) converter. The converter is a 7 bit flash converter with one half LSB accuracy. Typical parts will function at approximately 200 MHz. The converter uses a novel comparator circuit that is shown to out perform more traditional comparators, and thus increases the speed of the converter. The comparator is a clocked, precharged circuit that offers very fast operation with a minimal offset voltage (2 mv). The converter was designed using a standard 1 micron digital CMOS process and is 2,244 microns by 3,972 microns.

  7. Research-grade CMOS image sensors for remote sensing applications

    NASA Astrophysics Data System (ADS)

    Saint-Pe, Olivier; Tulet, Michel; Davancens, Robert; Larnaudie, Franck; Magnan, Pierre; Martin-Gonthier, Philippe; Corbiere, Franck; Belliot, Pierre; Estribeau, Magali

    2004-11-01

    Imaging detectors are key elements for optical instruments and sensors on board space missions dedicated to Earth observation (high resolution imaging, atmosphere spectroscopy...), Solar System exploration (micro cameras, guidance for autonomous vehicle...) and Universe observation (space telescope focal planes, guiding sensors...). This market has been dominated by CCD technology for long. Since the mid-90s, CMOS Image Sensors (CIS) have been competing with CCDs for consumer domains (webcams, cell phones, digital cameras...). Featuring significant advantages over CCD sensors for space applications (lower power consumption, smaller system size, better radiations behaviour...), CMOS technology is also expanding in this field, justifying specific R&D and development programs funded by national and European space agencies (mainly CNES, DGA and ESA). All along the 90s and thanks to their increasingly improving performances, CIS have started to be successfully used for more and more demanding space applications, from vision and control functions requiring low-level performances to guidance applications requiring medium-level performances. Recent technology improvements have made possible the manufacturing of research-grade CIS that are able to compete with CCDs in the high-performances arena. After an introduction outlining the growing interest of optical instruments designers for CMOS image sensors, this paper will present the existing and foreseen ways to reach high-level electro-optics performances for CIS. The developments and performances of CIS prototypes built using an imaging CMOS process will be presented in the corresponding section.

  8. Research-grade CMOS image sensors for demanding space applications

    NASA Astrophysics Data System (ADS)

    Saint-Pé, Olivier; Tulet, Michel; Davancens, Robert; Larnaudie, Franck; Magnan, Pierre; Corbière, Franck; Martin-Gonthier, Philippe; Belliot, Pierre

    2004-06-01

    Imaging detectors are key elements for optical instruments and sensors on board space missions dedicated to Earth observation (high resolution imaging, atmosphere spectroscopy...), Solar System exploration (micro cameras, guidance for autonomous vehicle...) and Universe observation (space telescope focal planes, guiding sensors...). This market has been dominated by CCD technology for long. Since the mid-90s, CMOS Image Sensors (CIS) have been competing with CCDs for more and more consumer domains (webcams, cell phones, digital cameras...). Featuring significant advantages over CCD sensors for space applications (lower power consumption, smaller system size, better radiations behaviour...), CMOS technology is also expanding in this field, justifying specific R&D and development programs funded by national and European space agencies (mainly CNES, DGA, and ESA). All along the 90s and thanks to their increasingly improving performances, CIS have started to be successfully used for more and more demanding applications, from vision and control functions requiring low-level performances to guidance applications requiring medium-level performances. Recent technology improvements have made possible the manufacturing of research-grade CIS that are able to compete with CCDs in the high-performances arena. After an introduction outlining the growing interest of optical instruments designers for CMOS image sensors, this talk will present the existing and foreseen ways to reach high-level electro-optics performances for CIS. The developments of CIS prototypes built using an imaging CMOS process and of devices based on improved designs will be presented.

  9. Beyond CMOS: heterogeneous integration of III-V devices, RF MEMS and other dissimilar materials/devices with Si CMOS to create intelligent microsystems.

    PubMed

    Kazior, Thomas E

    2014-03-28

    Advances in silicon technology continue to revolutionize micro-/nano-electronics. However, Si cannot do everything, and devices/components based on other materials systems are required. What is the best way to integrate these dissimilar materials and to enhance the capabilities of Si, thereby continuing the micro-/nano-electronics revolution? In this paper, I review different approaches to heterogeneously integrate dissimilar materials with Si complementary metal oxide semiconductor (CMOS) technology. In particular, I summarize results on the successful integration of III-V electronic devices (InP heterojunction bipolar transistors (HBTs) and GaN high-electron-mobility transistors (HEMTs)) with Si CMOS on a common silicon-based wafer using an integration/fabrication process similar to a SiGe BiCMOS process (BiCMOS integrates bipolar junction and CMOS transistors). Our III-V BiCMOS process has been scaled to 200 mm diameter wafers for integration with scaled CMOS and used to fabricate radio-frequency (RF) and mixed signals circuits with on-chip digital control/calibration. I also show that RF microelectromechanical systems (MEMS) can be integrated onto this platform to create tunable or reconfigurable circuits. Thus, heterogeneous integration of III-V devices, MEMS and other dissimilar materials with Si CMOS enables a new class of high-performance integrated circuits that enhance the capabilities of existing systems, enable new circuit architectures and facilitate the continued proliferation of low-cost micro-/nano-electronics for a wide range of applications. PMID:24567473

  10. Beyond CMOS: heterogeneous integration of III–V devices, RF MEMS and other dissimilar materials/devices with Si CMOS to create intelligent microsystems

    PubMed Central

    Kazior, Thomas E.

    2014-01-01

    Advances in silicon technology continue to revolutionize micro-/nano-electronics. However, Si cannot do everything, and devices/components based on other materials systems are required. What is the best way to integrate these dissimilar materials and to enhance the capabilities of Si, thereby continuing the micro-/nano-electronics revolution? In this paper, I review different approaches to heterogeneously integrate dissimilar materials with Si complementary metal oxide semiconductor (CMOS) technology. In particular, I summarize results on the successful integration of III–V electronic devices (InP heterojunction bipolar transistors (HBTs) and GaN high-electron-mobility transistors (HEMTs)) with Si CMOS on a common silicon-based wafer using an integration/fabrication process similar to a SiGe BiCMOS process (BiCMOS integrates bipolar junction and CMOS transistors). Our III–V BiCMOS process has been scaled to 200 mm diameter wafers for integration with scaled CMOS and used to fabricate radio-frequency (RF) and mixed signals circuits with on-chip digital control/calibration. I also show that RF microelectromechanical systems (MEMS) can be integrated onto this platform to create tunable or reconfigurable circuits. Thus, heterogeneous integration of III–V devices, MEMS and other dissimilar materials with Si CMOS enables a new class of high-performance integrated circuits that enhance the capabilities of existing systems, enable new circuit architectures and facilitate the continued proliferation of low-cost micro-/nano-electronics for a wide range of applications. PMID:24567473

  11. CMOS Integrated Carbon Nanotube Sensor

    SciTech Connect

    Perez, M. S.; Lerner, B.; Boselli, A.; Lamagna, A.; Obregon, P. D. Pareja; Julian, P. M.; Mandolesi, P. S.; Buffa, F. A.

    2009-05-23

    Recently carbon nanotubes (CNTs) have been gaining their importance as sensors for gases, temperature and chemicals. Advances in fabrication processes simplify the formation of CNT sensor on silicon substrate. We have integrated single wall carbon nanotubes (SWCNTs) with complementary metal oxide semiconductor process (CMOS) to produce a chip sensor system. The sensor prototype was designed and fabricated using a 0.30 um CMOS process. The main advantage is that the device has a voltage amplifier so the electrical measure can be taken and amplified inside the sensor. When the conductance of the SWCNTs varies in response to media changes, this is observed as a variation in the output tension accordingly.

  12. Contact CMOS imaging of gaseous oxygen sensor array

    PubMed Central

    Daivasagaya, Daisy S.; Yao, Lei; Yi Yung, Ka; Hajj-Hassan, Mohamad; Cheung, Maurice C.; Chodavarapu, Vamsy P.; Bright, Frank V.

    2014-01-01

    We describe a compact luminescent gaseous oxygen (O2) sensor microsystem based on the direct integration of sensor elements with a polymeric optical filter and placed on a low power complementary metal-oxide semiconductor (CMOS) imager integrated circuit (IC). The sensor operates on the measurement of excited-state emission intensity of O2-sensitive luminophore molecules tris(4,7-diphenyl-1,10-phenanthroline) ruthenium(II) ([Ru(dpp)3]2+) encapsulated within sol–gel derived xerogel thin films. The polymeric optical filter is made with polydimethylsiloxane (PDMS) that is mixed with a dye (Sudan-II). The PDMS membrane surface is molded to incorporate arrays of trapezoidal microstructures that serve to focus the optical sensor signals on to the imager pixels. The molded PDMS membrane is then attached with the PDMS color filter. The xerogel sensor arrays are contact printed on top of the PDMS trapezoidal lens-like microstructures. The CMOS imager uses a 32 × 32 (1024 elements) array of active pixel sensors and each pixel includes a high-gain phototransistor to convert the detected optical signals into electrical currents. Correlated double sampling circuit, pixel address, digital control and signal integration circuits are also implemented on-chip. The CMOS imager data is read out as a serial coded signal. The CMOS imager consumes a static power of 320 µW and an average dynamic power of 625 µW when operating at 100 Hz sampling frequency and 1.8 V DC. This CMOS sensor system provides a useful platform for the development of miniaturized optical chemical gas sensors. PMID:24493909

  13. Fundamental performance differences between CMOS and CCD imagers: Part II

    NASA Astrophysics Data System (ADS)

    Janesick, James; Andrews, James; Tower, John; Grygon, Mark; Elliott, Tom; Cheng, John; Lesser, Michael; Pinter, Jeff

    2007-09-01

    A new class of CMOS imagers that compete with scientific CCDs is presented. The sensors are based on deep depletion backside illuminated technology to achieve high near infrared quantum efficiency and low pixel cross-talk. The imagers deliver very low read noise suitable for single photon counting - Fano-noise limited soft x-ray applications. Digital correlated double sampling signal processing necessary to achieve low read noise performance is analyzed and demonstrated for CMOS use. Detailed experimental data products generated by different pixel architectures (notably 3TPPD, 5TPPD and 6TPG designs) are presented including read noise, charge capacity, dynamic range, quantum efficiency, charge collection and transfer efficiency and dark current generation. Radiation damage data taken for the imagers is also reported.

  14. Radiation Hard 0.13 Micron CMOS Library at IHP

    NASA Astrophysics Data System (ADS)

    Jagdhold, U.

    2013-08-01

    To support space applications we have developed an 0.13 micron CMOS library which should be radiation hard up to 200 krad. The article describes the concept to come to a radiation hard digital circuit and was introduces in 2010 [1]. By introducing new radiation hard design rules we will minimize IC-level leakage and single event latch-up (SEL). To reduce single event upset (SEU) we add two p-MOS transistors to all flip flops. For reliability reasons we use double contacts in all library elements. The additional rules and the library elements are integrated in our Cadence mixed signal design kit, “Virtuoso” IC6.1 [2]. A test chip is produced with our in house 0.13 micron BiCMOS technology, see Ref. [3]. As next step we will doing radiation tests according the european space agency (ESA) specifications, see Ref. [4], [5].

  15. Characterization of a CMOS detector for limited-view mammography

    NASA Astrophysics Data System (ADS)

    Elbakri, Idris A.

    2007-03-01

    Sensors based on complementary metal oxide semiconductors (CMOS) technology have recently been considered for mammography applications. CMOS offers the advantages of lower cost and relative ease of fabrications. We report on the evaluation of a CMOS imager (C9730DK, Hamamatsu Corporation) with 14-bit digitization and 50-micron detector element (del) resolution. The imager has an active area of 5 x 5 cm and uses 160-micron layer of needle-crystal CsI (55 mg/cc) to convert x-rays to light. The detector is suitable for spot and specimen imaging and image-guided biopsy. To evaluate resolution performance, we measured the modulation transfer function (MTF) using the slanted edge method. We also measured the normalized noise power spectrum (NNPS) using Fourier analysis of uniform images. The MTF and NNPS were used to determine the detective quantum efficiency (DQE) of the detector. The detector was characterized using a molybdenum target/molybdenum filter mammography x-ray source operated at 28 kVp with 44mm of PMMA added to mimic clinical beam quality (HVL = 0.62 mm Al). Our analysis showed that the imager had a linear response. The MTF was 28% at 5 lp/mm and 8% at 10 lp/mm. The product of the NNPS and exposure showed that the detector was quantum limited. The DQE near 0 lp/mm was in the 55-60% range. The DQE and MTF performance of the CMOS detector are comparable to published values for other digital mammography detectors.

  16. Multiband CMOS sensor simplify FPA design

    NASA Astrophysics Data System (ADS)

    Wang, Weng Lyang B.; Ling, Jer

    2015-10-01

    Push broom multi-band Focal Plane Array (FPA) design needs to consider optics, image sensor, electronic, mechanic as well as thermal. Conventional FPA use two or several CCD device as an image sensor. The CCD image sensor requires several high speed, high voltage and high current clock drivers as well as analog video processors to support their operation. Signal needs to digitize using external sample / hold and digitized circuit. These support circuits are bulky, consume a lot of power, must be shielded and placed in close to the CCD to minimize the introduction of unwanted noise. The CCD also needs to consider how to dissipate power. The end result is a very complicated FPA and hard to make due to more weighs and draws more power requiring complex heat transfer mechanisms. In this paper, we integrate microelectronic technology and multi-layer soft / hard Printed Circuit Board (PCB) technology to design electronic portion. Since its simplicity and integration, the optics, mechanic, structure and thermal design will become very simple. The whole FPA assembly and dis-assembly reduced to a few days. A multi-band CMOS Sensor (dedicated as C468) was used for this design. The CMOS Sensor, allow for the incorporation of clock drivers, timing generators, signal processing and digitization onto the same Integrated Circuit (IC) as the image sensor arrays. This keeps noise to a minimum while providing high functionality at reasonable power levels. The C468 is a first Multiple System-On-Chip (MSOC) IC. This device used our proprietary wafer butting technology and MSOC technology to combine five long sensor arrays into a size of 120 mm x 23.2 mm and 155 mm x 60 mm for chip and package, respectively. The device composed of one Panchromatic (PAN) and four different Multi- Spectral (MS) sensors. Due to its integration on the electronic design, a lot of room is clear for the thermal design. The optical and mechanical design is become very straight forward. The flight model FPA

  17. CMOS Integrated Single Electron Transistor Electrometry (CMOS-SET) circuit design for nanosecond quantum-bit read-out.

    SciTech Connect

    Gurrieri, Thomas M.; Lilly, Michael Patrick; Carroll, Malcolm S.; Levy, James E.

    2008-08-01

    Novel single electron transistor (SET) read-out circuit designs are described. The circuits use a silicon SET interfaced to a CMOS voltage mode or current mode comparator to obtain a digital read-out of the state of the qubit. The design assumes standard submicron (0.35 um) CMOS SOI technology using room temperature SPICE models. Implications and uncertainties related to the temperature scaling of these models to 100mK operation are discussed. Using this technology, the simulations predict a read-out operation speed of approximately Ins and a power dissipation per cell as low as 2nW for single-shot read-out, which is a significant advantage over currently used radio frequency SET (RF-SET) approaches.

  18. Low Power Camera-on-a-Chip Using CMOS Active Pixel Sensor Technology

    NASA Technical Reports Server (NTRS)

    Fossum, E. R.

    1995-01-01

    A second generation image sensor technology has been developed at the NASA Jet Propulsion Laboratory as a result of the continuing need to miniaturize space science imaging instruments. Implemented using standard CMOS, the active pixel sensor (APS) technology permits the integration of the detector array with on-chip timing, control and signal chain electronics, including analog-to-digital conversion.

  19. Evaluation of a CMOS image detector for low-cost and power medical x-ray imaging applications

    NASA Astrophysics Data System (ADS)

    Smith, Scott T.; Bednarek, Daniel R.; Wobschall, Darold C.; Jeong, Myoungki; Kim, Hyunkeun; Rudin, Stephen

    1999-05-01

    Recent developments in CMOS image detectors are changing the way digital imaging is performed for many applications. The replacement of charge coupled devices (CCDs), with CMOS detectors is a desirable paradigm shift that will depend on the ability to match the high performance characteristics of CCDs. Digital X-ray imaging applications (chest X-ray, mammography) would benefit greatly from this shift because CMOS detectors have the following inherent characteristics: (1) Low operating power (5 - 10 times lower than CCD/processing electronics). (2) Standard CMOS manufacturing process (CCD requires special manufacturing). (3) On-chip integration of analog/digital processing functions (difficult with CCD). (4) Low Cost (5 - 10 times lower cost than CCD). The achievement of both low cost and low power is highly desirable for portable applications as well as situations where large, expensive X-ray imaging machines are not feasible (small hospitals and clinics, emergency medical vehicles, remote sites). Achieving this goal using commercially available components would allow rapid development of such digital X-ray systems as compared with the development difficulties incurred through specialized direct detectors and systems. The focus of this paper is to evaluate a CMOS image detector for medical X-ray applications and to demonstrate the results obtained from a prototype CMOS digital X-ray camera. Results from the images collected from this optically-coupled camera are presented for a particular lens, X-ray conversion screen, and demagnification factor. Further, an overview of the overall power consumption and cost of a multi-sensor CMOS mosaic compared to its CCD counterpart are also reported.

  20. NV-CMOS HD camera for day/night imaging

    NASA Astrophysics Data System (ADS)

    Vogelsong, T.; Tower, J.; Sudol, Thomas; Senko, T.; Chodelka, D.

    2014-06-01

    SRI International (SRI) has developed a new multi-purpose day/night video camera with low-light imaging performance comparable to an image intensifier, while offering the size, weight, ruggedness, and cost advantages enabled by the use of SRI's NV-CMOS HD digital image sensor chip. The digital video output is ideal for image enhancement, sharing with others through networking, video capture for data analysis, or fusion with thermal cameras. The camera provides Camera Link output with HD/WUXGA resolution of 1920 x 1200 pixels operating at 60 Hz. Windowing to smaller sizes enables operation at higher frame rates. High sensitivity is achieved through use of backside illumination, providing high Quantum Efficiency (QE) across the visible and near infrared (NIR) bands (peak QE <90%), as well as projected low noise (<2h+) readout. Power consumption is minimized in the camera, which operates from a single 5V supply. The NVCMOS HD camera provides a substantial reduction in size, weight, and power (SWaP) , ideal for SWaP-constrained day/night imaging platforms such as UAVs, ground vehicles, fixed mount surveillance, and may be reconfigured for mobile soldier operations such as night vision goggles and weapon sights. In addition the camera with the NV-CMOS HD imager is suitable for high performance digital cinematography/broadcast systems, biofluorescence/microscopy imaging, day/night security and surveillance, and other high-end applications which require HD video imaging with high sensitivity and wide dynamic range. The camera comes with an array of lens mounts including C-mount and F-mount. The latest test data from the NV-CMOS HD camera will be presented.

  1. High-voltage CMOS detectors

    NASA Astrophysics Data System (ADS)

    Ehrler, F.; Blanco, R.; Leys, R.; Perić, I.

    2016-07-01

    High-voltage CMOS (HVCMOS) pixel sensors are depleted active pixel sensors implemented in standard commercial CMOS processes. The sensor element is the n-well/p-substrate diode. The sensor electronics are entirely placed inside the n-well which is at the same time used as the charge collection electrode. High voltage is used to deplete the part of the substrate around the n-well. HVCMOS sensors allow implementation of complex in-pixel electronics. This, together with fast signal collection, allows a good time resolution, which is required for particle tracking in high energy physics. HVCMOS sensors will be used in Mu3e experiment at PSI and are considered as an option for both ATLAS and CLIC (CERN). Radiation tolerance and time walk compensation have been tested and results are presented.

  2. A CMOS readout system for very large detector capacitances

    NASA Astrophysics Data System (ADS)

    Schoeneberg, U.; Hosticka, B. J.; Fent, J.; Oberlack, H.; Zimmer, G.

    1990-03-01

    In this contribution we present readout electronics for a liquid-argon calorimeter. It has been designed and optimized for operation at cryogenic temperatures and it is integrated in an n-well 2 μm CMOS technology. The chip contains 16 analog channels with switched-capacitor circuits for charge collection, storage, and amplification, and averaging and correlated double sampling circuits for noise reduction. Further components include a trigger generator, an analog multiplexer, digital control circuits for analog switching, and 50 ω cable drivers.

  3. A quasi-passive CMOS pipeline D/A converter

    NASA Technical Reports Server (NTRS)

    Wang, Fong-Jim; Temes, Gabor C.; Law, Simon

    1989-01-01

    A novel pipeline digital-to-analog converter configuration, based on switched-capacitor techniques, is described. An n-bit D/A conversion can be implemented by cascading n + 1 unit cells. The device count of the circuit increases linearly, not exponentially, with the conversion accuracy. The new configuration can be pipelined. Hence, the conversion rate can be increased without requiring a higher clock rate. An experimental 10-bit DAC prototype has been fabricated using a 3-micron CMOS process. The results show that high-speed, high-accuracy, and low-power operation can be achieved without special process or postprocess trimming.

  4. High-Voltage-Input Level Translator Using Standard CMOS

    NASA Technical Reports Server (NTRS)

    Yager, Jeremy A.; Mojarradi, Mohammad M.; Vo, Tuan A.; Blalock, Benjamin J.

    2011-01-01

    proposed integrated circuit would translate (1) a pair of input signals having a low differential potential and a possibly high common-mode potential into (2) a pair of output signals having the same low differential potential and a low common-mode potential. As used here, "low" and "high" refer to potentials that are, respectively, below or above the nominal supply potential (3.3 V) at which standard complementary metal oxide/semiconductor (CMOS) integrated circuits are designed to operate. The input common-mode potential could lie between 0 and 10 V; the output common-mode potential would be 2 V. This translation would make it possible to process the pair of signals by use of standard 3.3-V CMOS analog and/or mixed-signal (analog and digital) circuitry on the same integrated-circuit chip. A schematic of the circuit is shown in the figure. Standard 3.3-V CMOS circuitry cannot withstand input potentials greater than about 4 V. However, there are many applications that involve low-differential-potential, high-common-mode-potential input signal pairs and in which standard 3.3-V CMOS circuitry, which is relatively inexpensive, would be the most appropriate circuitry for performing other functions on the integrated-circuit chip that handles the high-potential input signals. Thus, there is a need to combine high-voltage input circuitry with standard low-voltage CMOS circuitry on the same integrated-circuit chip. The proposed circuit would satisfy this need. In the proposed circuit, the input signals would be coupled into both a level-shifting pair and a common-mode-sensing pair of CMOS transistors. The output of the level-shifting pair would be fed as input to a differential pair of transistors. The resulting differential current output would pass through six standoff transistors to be mirrored into an output branch by four heterojunction bipolar transistors. The mirrored differential current would be converted back to potential by a pair of diode-connected transistors

  5. Fabrication of CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Malinovich, Yacov; Koltin, Ephie; Choen, David; Shkuri, Moshe; Ben-Simon, Meir

    1999-04-01

    In order to provide its customers with sub-micron CMOS fabrication solutions for imaging applications, Tower Semiconductor initiated a project to characterize the optical parameters of Tower's 0.5-micron process. A special characterization test chip was processed using the TS50 process. The results confirmed a high quality process for optical applications. Perhaps the most important result is the process' very low dark current, of 30-50 pA/cm2, using the entire window of process. This very low dark current characteristic was confirmed for a variety of pixel architectures. Additionally, we have succeeded to reduce and virtually eliminate the white spots on large sensor arrays. As a foundry Tower needs to support fabrication of many different imaging products. Therefore we have developed a fabrication methodology that is adjusted to the special needs of optical applications. In order to establish in-line process monitoring of the optical parameters, Tower places a scribe line optical test chip that enables wafer level measurements of the most important parameters, ensuring the optical quality and repeatability of the process. We have developed complementary capabilities like in house deposition of color filter and fabrication of very large are dice using sub-micron CMOS technologies. Shellcase and Tower are currently developing a new CMOS image sensor optical package.

  6. CMOS downsizing toward sub-10 nm

    NASA Astrophysics Data System (ADS)

    Iwai, Hiroshi

    2004-04-01

    Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into the market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.

  7. A review on high-resolution CMOS delay lines: towards sub-picosecond jitter performance.

    PubMed

    Abdulrazzaq, Bilal I; Abdul Halin, Izhal; Kawahito, Shoji; Sidek, Roslina M; Shafie, Suhaidi; Yunus, Nurul Amziah Md

    2016-01-01

    A review on CMOS delay lines with a focus on the most frequently used techniques for high-resolution delay step is presented. The primary types, specifications, delay circuits, and operating principles are presented. The delay circuits reported in this paper are used for delaying digital inputs and clock signals. The most common analog and digitally-controlled delay elements topologies are presented, focusing on the main delay-tuning strategies. IC variables, namely, process, supply voltage, temperature, and noise sources that affect delay resolution through timing jitter are discussed. The design specifications of these delay elements are also discussed and compared for the common delay line circuits. As a result, the main findings of this paper are highlighting and discussing the followings: the most efficient high-resolution delay line techniques, the trade-off challenge found between CMOS delay lines designed using either analog or digitally-controlled delay elements, the trade-off challenge between delay resolution and delay range and the proposed solutions for this challenge, and how CMOS technology scaling can affect the performance of CMOS delay lines. Moreover, the current trends and efforts used in order to generate output delayed signal with low jitter in the sub-picosecond range are presented. PMID:27104122

  8. Analysis of noise characteristics for the active pixels in CMOS image sensors for X-ray imaging

    NASA Astrophysics Data System (ADS)

    Kim, Young Soo; Cho, Gyuseong; Bae, Jun-Hyung

    2006-09-01

    CMOS image sensors have poorer performance compared to conventional charge coupled devices (CCDs). Since CMOS Active Pixel Sensors (APSs) in general have higher temporal noise, higher dark current, smaller full well charge capacitance, and lower spectral response, they cannot provide the same wide dynamic range and superior signal to noise ratio as CCDs. In view of electronic noise, the main source for the CMOS APS is the pixel, along with other signal processing blocks such as row and column decoder, analog signal processor (ASP), analog-to-digital converter (ADC), and timing and control logic circuitry. Therefore, it is important and necessary to characterize noise of the active pixels in CMOS APSs, and we performed experimental measurements and comparisons with theoretical estimations. To derive noise source of the pixels, we designed and fabricated four types of CMOS active pixels, and each pixel is composed of a photodiode and three MOS transistors. The size of these pixels is 100 μm×100 μm. The test chip was fabricated using ETRI 0.8 μm (2P/2M) standard CMOS process. It was found that the dominant noise in CMOS active pixels is shot noise during integration under normal operating conditions. And, it was also seen that epitaxial type pixels have similar noise level compared to non-epitaxial type, and the noise of diffusion type pixel is larger than for a well type pixel on the same substrate type.

  9. A CMOS readout circuit for microstrip detectors

    NASA Astrophysics Data System (ADS)

    Nasri, B.; Fiorini, C.

    2015-03-01

    In this work, we present the design and the results of a CMOS analog channel for silicon microstrips detectors. The readout circuit was initially conceived for the outer layers of the SuperB silicon vertex tracker (SVT), but can serve more generally other microstrip-based detection systems. The strip detectors considered show a very high stray capacitance and high series resistance. Therefore, the noise optimization was the first priority design concern. A necessary compromise on the best peaking time to achieve an acceptable noise level together with efficiency and timing accuracy has been investigated. The ASIC is composed by a preamplifier, shaping amplifier and a Time over Threshold (T.o.T) block for the digitalization of the signals. The chosen shaping function is the third-order semi-Gaussian function implemented with complex poles. An inverter stage is employed in the analog channel in order to operate with signals delivered from both p and n strips. The circuit includes the possibility to select the peaking time of the shaper output from four values: 250 ns, 375 ns, 500 ns and 750 ns. In this way, the noise performances and the signal occupancy can be optimized according to the real background during the experiment. The ASIC prototype has been fabricated in the 130 nm IBM technology which is considered intrinsically radiation hard. The results of the experimental characterization of a produced prototype are satisfactorily matched with simulation.

  10. A CMOS analog front-end chip for amperometric electrochemical sensors

    NASA Astrophysics Data System (ADS)

    Zhichao, Li; Yuntao, Liu; Min, Chen; Jingbo, Xiao; Jie, Chen

    2015-07-01

    This paper reports a complimentary metal-oxide-semiconductor (CMOS) analog front-end chip for amperometric electrochemical sensors. The chip includes a digital configuration circuit, which can communicate with an external microcontroller by employing an I2C interface bus, and thus is highly programmable. Digital correlative double samples technique and an incremental sigma-delta analog to digital converter (Σ-Δ ADC) are employed to achieve a new proposed system architecture with double samples. The chip has been fabricated in a standard 0.18-μm CMOS process with high-precision and high-linearity performance occupying an area of 1.3 × 1.9 mm2. Sample solutions with various phosphate concentrations have been detected with a step concentration of 0.01 mg/L. Project supported by the National Key Basic Research and Development Project (No. 2015CB352103).

  11. Imagers for digital still photography

    NASA Astrophysics Data System (ADS)

    Bosiers, Jan; Dillen, Bart; Draijer, Cees; Manoury, Erik-Jan; Meessen, Louis; Peters, Inge

    2006-04-01

    This paper gives an overview of the requirements for, and current state-of-the-art of, CCD and CMOS imagers for use in digital still photography. Four market segments will be reviewed: mobile imaging, consumer "point-and-shoot cameras", consumer digital SLR cameras and high-end professional camera systems. The paper will also present some challenges and innovations with respect to packaging, testing, and system integration.

  12. CMOS foveal image sensor chip

    NASA Technical Reports Server (NTRS)

    Bandera, Cesar (Inventor); Scott, Peter (Inventor); Sridhar, Ramalingam (Inventor); Xia, Shu (Inventor)

    2002-01-01

    A foveal image sensor integrated circuit comprising a plurality of CMOS active pixel sensors arranged both within and about a central fovea region of the chip. The pixels in the central fovea region have a smaller size than the pixels arranged in peripheral rings about the central region. A new photocharge normalization scheme and associated circuitry normalizes the output signals from the different size pixels in the array. The pixels are assembled into a multi-resolution rectilinear foveal image sensor chip using a novel access scheme to reduce the number of analog RAM cells needed. Localized spatial resolution declines monotonically with offset from the imager's optical axis, analogous to biological foveal vision.

  13. Nanosecond monolithic CMOS readout cell

    DOEpatents

    Souchkov, Vitali V.

    2004-08-24

    A pulse shaper is implemented in monolithic CMOS with a delay unit formed of a unity gain buffer. The shaper is formed of a difference amplifier having one input connected directly to an input signal and a second input connected to a delayed input signal through the buffer. An elementary cell is based on the pulse shaper and a timing circuit which gates the output of an integrator connected to the pulse shaper output. A detector readout system is formed of a plurality of elementary cells, each connected to a pixel of a pixel array, or to a microstrip of a plurality of microstrips, or to a detector segment.

  14. Accelerated life testing effects on CMOS microcircuit characteristics

    NASA Technical Reports Server (NTRS)

    1977-01-01

    Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. The consistency of the CMOS microcircuit activation energy between the range of 125 C to 200 C and the range 200 C to 250 C was determined. Results indicate CMOS complexity and the amount of moisture detected inside the devices after testing influences time to failure of tested CMOS devices.

  15. Macromodel for exact computation of propagation delay time in GaAs and CMOS technologies

    NASA Astrophysics Data System (ADS)

    Garcia, Jose C.; Montiel-Nelson, Juan A.; Sosa, Javier; Navarro, Hector; Sarmiento, Roberto

    2003-04-01

    A new transient macromodel for the cells used in DCFL GaAs and CMOS digital design is introduced in this paper. The numerical solution determines accurate propagation delay times. The macromodel is based on the differential equation for the output voltage in terms of currents and capacitances. An straightforward treatment of the differential equation for an inverter in DCFL GaAs and CMOS has been obtained. It could be resolved numerically by a 4th order Runge Kutta method. Good agreement is obtained between the HSPICE simulation and the computation of the propagation delays for DCFL GaAs and CMOS basic gates: INV, NOR, OR and NAND. There is no error between HSPICE and our computation of propagation delay time for the high to low (tphl) and low to high (tplh) transitions. The propagation delay times for two types of transition were measured and compared with HSPICE. The results demonstrate that our approach matches with HSPICE with no error. The numerical method was programmed in C language. In addition, computation time analysis is provided and numerical solution is several orders of magnitude faster than HSPICE. Work is in progress to obtain the macromodel of a standard cell library for digital application both for a 0.6 microns E/D GaAs process (H-GaAsIV) from Vitesse Semiconductor and for a 0.18 microns logic/mixed-signal CMOS process (1P6M) from TSMC Corp.

  16. Real-time DNA Amplification and Detection System Based on a CMOS Image Sensor.

    PubMed

    Wang, Tiantian; Devadhasan, Jasmine Pramila; Lee, Do Young; Kim, Sanghyo

    2016-01-01

    In the present study, we developed a polypropylene well-integrated complementary metal oxide semiconductor (CMOS) platform to perform the loop mediated isothermal amplification (LAMP) technique for real-time DNA amplification and detection simultaneously. An amplification-coupled detection system directly measures the photon number changes based on the generation of magnesium pyrophosphate and color changes. The photon number decreases during the amplification process. The CMOS image sensor observes the photons and converts into digital units with the aid of an analog-to-digital converter (ADC). In addition, UV-spectral studies, optical color intensity detection, pH analysis, and electrophoresis detection were carried out to prove the efficiency of the CMOS sensor based the LAMP system. Moreover, Clostridium perfringens was utilized as proof-of-concept detection for the new system. We anticipate that this CMOS image sensor-based LAMP method will enable the creation of cost-effective, label-free, optical, real-time and portable molecular diagnostic devices. PMID:27302586

  17. CMOS image sensor for detection of interferon gamma protein interaction as a point-of-care approach.

    PubMed

    Marimuthu, Mohana; Kandasamy, Karthikeyan; Ahn, Chang Geun; Sung, Gun Yong; Kim, Min-Gon; Kim, Sanghyo

    2011-09-01

    Complementary metal oxide semiconductor (CMOS)-based image sensors have received increased attention owing to the possibility of incorporating them into portable diagnostic devices. The present research examined the efficiency and sensitivity of a CMOS image sensor for the detection of antigen-antibody interactions involving interferon gamma protein without the aid of expensive instruments. The highest detection sensitivity of about 1 fg/ml primary antibody was achieved simply by a transmission mechanism. When photons are prevented from hitting the sensor surface, a reduction in digital output occurs in which the number of photons hitting the sensor surface is approximately proportional to the digital number. Nanoscale variation in substrate thickness after protein binding can be detected with high sensitivity by the CMOS image sensor. Therefore, this technique can be easily applied to smartphones or any clinical diagnostic devices for the detection of several biological entities, with high impact on the development of point-of-care applications. PMID:21773736

  18. Polarization- and wavelength-sensitive sub-wavelength structures fabricated in the metal layers of deep submicron CMOS processes

    NASA Astrophysics Data System (ADS)

    Junger, Stephan; Tschekalinskij, Wladimir; Verwaal, Nanko; Weber, Norbert

    2010-05-01

    Sub-wavelength structures in metal films have interesting optical properties that can be implemented for sensing applications: gratings act as wire grid polarizer, hole arrays with enhanced transmission can be used as spectral filters. This paper demonstrates the feasibility of these nanostructures using 180 nm and 90 nm complementary metal-oxide semiconductor (CMOS) processes. The metal layers of the process can be used for optical nanostructures with feature sizes down to 100 nm. We describe the design and simulation of these metal structures using the finite-difference timedomain (FDTD) method. The spectral response of the test structures was measured for different polarizations, where the gratings showed typical features of wire grid polarizers. Using a 180 nm CMOS image sensor process, an image sensor with 6 μm pixel size was designed and fabricated with different polarization selective structures allowing for polarization imaging. A polarization camera using this image sensor is demonstrated, visualizing stress birefringence as an application example. Finally, first results on the fabrication of hole arrays with a period of 320 nm are presented, showing color filters with enhanced transmission.

  19. Carbon Nanotube Integration with a CMOS Process

    PubMed Central

    Perez, Maximiliano S.; Lerner, Betiana; Resasco, Daniel E.; Pareja Obregon, Pablo D.; Julian, Pedro M.; Mandolesi, Pablo S.; Buffa, Fabian A.; Boselli, Alfredo; Lamagna, Alberto

    2010-01-01

    This work shows the integration of a sensor based on carbon nanotubes using CMOS technology. A chip sensor (CS) was designed and manufactured using a 0.30 μm CMOS process, leaving a free window on the passivation layer that allowed the deposition of SWCNTs over the electrodes. We successfully investigated with the CS the effect of humidity and temperature on the electrical transport properties of SWCNTs. The possibility of a large scale integration of SWCNTs with CMOS process opens a new route in the design of more efficient, low cost sensors with high reproducibility in their manufacture. PMID:22319330

  20. Biosensing with integrated CMOS nanopores

    NASA Astrophysics Data System (ADS)

    Uddin, Ashfaque; Yemenicioglu, Sukru; Chen, Chin-Hsuan; Corgliano, Ellie; Milaninia, Kaveh; Xia, Fan; Plaxco, Kevin; Theogarajan, Luke

    2012-10-01

    This paper outlines our recent efforts in using solid-state nanopores as a biosensing platform. Traditionally biosensors concentrate mainly on the detection platform and not on signal processing. This decoupling can lead to inferior sensors and is exacerbated in nanoscale devices, where device noise is large and large dynamic range is required. This paper outlines a novel platform that integrates the nano, micro and macroscales in a closely coupled manner that mitigates many of these problems. We discuss our initial results of DNA translocation through the nanopore. We also briefly discuss the use of molecular recognition properties of aptamers with the versatility of the nanopore detector to design a new class of biosensors in a CMOS compatible platform.

  1. Readout circuit design of the retina-like CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Cao, Fengmei; Song, Shengyu; Bai, Tingzhu; Cao, Nan

    2015-02-01

    Readout circuit is designed for a special retina-like CMOS image sensor. To realize the pixels timing drive and readout of the sensor, the Altera's Cyclone II FPGA is used as a control chip. The voltage of the sensor is supported by a voltage chip initialized by SPI with AVR MCU system. The analog image signal outputted by the sensor is converted to digital image data by 12-bits A/D converter ADS807 and the digital data is memorized in the SRAM. Using the Camera-link image grabber, the data stored in SRAM is transformed to image shown on PC. Experimental results show the circuit works well on retina-like CMOS timing drive and image readout and images can be displayed properly on the PC.

  2. Yield enhancement methodologies for 90-nm technology and beyond

    NASA Astrophysics Data System (ADS)

    Allgair, John; Carey, Todd; Dougan, James; Etnyre, Tony; Langdon, Nate; Murray, Brooke

    2006-03-01

    In order to stay competitive in the rapidly advancing international semiconductor industry, a manufacturing company needs to continually focus on several areas including rapid yield learning, manufacturing cost, statistical process control limits, process yield, equipment availability, cycle time, turns per direct labor hour, customer on time delivery and zero customer defects. To hold a competitive position in the semiconductor market, performance to these measurable factors mut be maintained regardless of the technology generation. In this presentation, the methodology applied by Freescale Semiconductor to achieve the fastest yield learning curve in the industry, as cited by Dr. Robert Leachman of UC Berkley in 2003, will be discussed.

  3. Effect of coupling parasitics and CMOS driver width on transition time for dynamic inputs

    NASA Astrophysics Data System (ADS)

    Sharma, Devendra Kumar; Kaushik, Brajesh Kumar; Sharma, R. K.

    2014-05-01

    This article analyses the effect of coupling parasitics and CMOS gate driver width on transition time delay of coupled interconnects driven by dynamically switching inputs. Propagation delay through an interconnect is dependent not only on the technology/topology but also on many other factors such as input transition time, load characteristic, driving gate dimensions and so on. The delay is affected by rise/fall time of the signal, which in turn is dependent on the driving gate and the load presented to it. The signal transition time is also a strong function of wire parasitics. This article addresses the different issues of signal transition time. The impact of inter-wire parasitics and driver width on signal transition time are presented in this article. Furthermore, the effect of unequal transition time of the inputs to interconnect lines on crosstalk noise and delay is analysed. To demonstrate these effects, two distributed RLC lines coupled capacitively and inductively are taken into consideration. The simulations are run at three different technology nodes, viz. 65 nm, 90 nm and 130 nm.

  4. All digital pulsewidth control loop

    NASA Astrophysics Data System (ADS)

    Huang, Hong-Yi; Jan, Shiun-Dian; Pu, Ruei-Iun

    2013-03-01

    This work presents an all-digital pulsewidth control loop (ADPWCL). The proposed system accepts a wide range of input duty cycles and performs a fast correction to the target output pulsewidth. An all-digital delay-locked loop (DLL) with fast locking time using a simplified time to digital converter and a new differential two-step delay element is proposed. The area of the delay element is much smaller than that in conventional designs, while having the same delay range. A test chip is verified in a 0.18-µm CMOS process. The measured duty cycle ranges from 4% to 98% with 7-bit resolution.

  5. Design considerations for a new, high resolution Micro-Angiographic Fluoroscope based on a CMOS sensor (MAF-CMOS)

    PubMed Central

    Loughran, Brendan; Swetadri Vasan, S. N.; Singh, Vivek; Ionita, Ciprian N.; Jain, Amit; Bednarek, Daniel R.; Titus, Albert; Rudin, Stephen

    2013-01-01

    The detectors that are used for endovascular image-guided interventions (EIGI), particularly for neurovascular interventions, do not provide clinicians with adequate visualization to ensure the best possible treatment outcomes. Developing an improved x-ray imaging detector requires the determination of estimated clinical x-ray entrance exposures to the detector. The range of exposures to the detector in clinical studies was found for the three modes of operation: fluoroscopic mode, high frame-rate digital angiographic mode (HD fluoroscopic mode), and DSA mode. Using these estimated detector exposure ranges and available CMOS detector technical specifications, design requirements were developed to pursue a quantum limited, high resolution, dynamic x-ray detector based on a CMOS sensor with 50 μm pixel size. For the proposed MAF-CMOS, the estimated charge collected within the full exposure range was found to be within the estimated full well capacity of the pixels. Expected instrumentation noise for the proposed detector was estimated to be 50–1,300 electrons. Adding a gain stage such as a light image intensifier would minimize the effect of the estimated instrumentation noise on total image noise but may not be necessary to ensure quantum limited detector operation at low exposure levels. A recursive temporal filter may decrease the effective total noise by 2 to 3 times, allowing for the improved signal to noise ratios at the lowest estimated exposures despite consequent loss in temporal resolution. This work can serve as a guide for further development of dynamic x-ray imaging prototypes or improvements for existing dynamic x-ray imaging systems. PMID:24353389

  6. Design considerations for a new, high resolution Micro-Angiographic Fluoroscope based on a CMOS sensor (MAF-CMOS).

    PubMed

    Loughran, Brendan; Swetadri Vasan, S N; Singh, Vivek; Ionita, Ciprian N; Jain, Amit; Bednarek, Daniel R; Titus, Albert; Rudin, Stephen

    2013-03-01

    The detectors that are used for endovascular image-guided interventions (EIGI), particularly for neurovascular interventions, do not provide clinicians with adequate visualization to ensure the best possible treatment outcomes. Developing an improved x-ray imaging detector requires the determination of estimated clinical x-ray entrance exposures to the detector. The range of exposures to the detector in clinical studies was found for the three modes of operation: fluoroscopic mode, high frame-rate digital angiographic mode (HD fluoroscopic mode), and DSA mode. Using these estimated detector exposure ranges and available CMOS detector technical specifications, design requirements were developed to pursue a quantum limited, high resolution, dynamic x-ray detector based on a CMOS sensor with 50 μm pixel size. For the proposed MAF-CMOS, the estimated charge collected within the full exposure range was found to be within the estimated full well capacity of the pixels. Expected instrumentation noise for the proposed detector was estimated to be 50-1,300 electrons. Adding a gain stage such as a light image intensifier would minimize the effect of the estimated instrumentation noise on total image noise but may not be necessary to ensure quantum limited detector operation at low exposure levels. A recursive temporal filter may decrease the effective total noise by 2 to 3 times, allowing for the improved signal to noise ratios at the lowest estimated exposures despite consequent loss in temporal resolution. This work can serve as a guide for further development of dynamic x-ray imaging prototypes or improvements for existing dynamic x-ray imaging systems. PMID:24353389

  7. Design considerations for a new high resolution Micro-Angiographic Fluoroscope based on a CMOS sensor (MAF-CMOS)

    NASA Astrophysics Data System (ADS)

    Loughran, Brendan; Swetadri Vasan, S. N.; Singh, Vivek; Ionita, Ciprian N.; Jain, Amit; Bednarek, Daniel R.; Titus, Albert H.; Rudin, Stephen

    2013-03-01

    The detectors that are used for endovascular image-guided interventions (EIGI), particularly for neurovascular interventions, do not provide clinicians with adequate visualization to ensure the best possible treatment outcomes. Developing an improved x-ray imaging detector requires the determination of estimated clinical x-ray entrance exposures to the detector. The range of exposures to the detector in clinical studies was found for the three modes of operation: fluoroscopic mode, high frame-rate digital angiographic mode (HD fluoroscopic mode), and DSA mode. Using these estimated detector exposure ranges and available CMOS detector technical specifications, design requirements were developed to pursue a quantum limited, high resolution, dynamic x-ray detector based on a CMOS sensor with 50 μm pixel size. For the proposed MAF-CMOS, the estimated charge collected within the full exposure range was found to be within the estimated full well capacity of the pixels. Expected instrumentation noise for the proposed detector was estimated to be 50-1,300 electrons. Adding a gain stage such as a light image intensifier would minimize the effect of the estimated instrumentation noise on total image noise but may not be necessary to ensure quantum limited detector operation at low exposure levels. A recursive temporal filter may decrease the effective total noise by 2 to 3 times, allowing for the improved signal to noise ratios at the lowest estimated exposures despite consequent loss in temporal resolution. This work can serve as a guide for further development of dynamic x-ray imaging prototypes or improvements for existing dynamic x-ray imaging systems.

  8. A CMOS Smart Temperature and Humidity Sensor with Combined Readout

    PubMed Central

    Eder, Clemens; Valente, Virgilio; Donaldson, Nick; Demosthenous, Andreas

    2014-01-01

    A fully-integrated complementary metal-oxide semiconductor (CMOS) sensor for combined temperature and humidity measurements is presented. The main purpose of the device is to monitor the hermeticity of micro-packages for implanted integrated circuits and to ensure their safe operation by monitoring the operating temperature and humidity on-chip. The smart sensor has two modes of operation, in which either the temperature or humidity is converted into a digital code representing a frequency ratio between two oscillators. This ratio is determined by the ratios of the timing capacitances and bias currents in both oscillators. The reference oscillator is biased by a current whose temperature dependency is complementary to the proportional to absolute temperature (PTAT) current. For the temperature measurement, this results in an exceptional normalized sensitivity of about 0.77%/°C at the accepted expense of reduced linearity. The humidity sensor is a capacitor, whose value varies linearly with relative humidity (RH) with a normalized sensitivity of 0.055%/% RH. For comparison, two versions of the humidity sensor with an area of either 0.2 mm2 or 1.2 mm2 were fabricated in a commercial 0.18 μm CMOS process. The on-chip readout electronics operate from a 5 V power supply and consume a current of approximately 85 μA. PMID:25230305

  9. CMOS-TDI detector technology for reconnaissance application

    NASA Astrophysics Data System (ADS)

    Eckardt, Andreas; Reulke, Ralf; Jung, Melanie; Sengebusch, Karsten

    2014-10-01

    The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 30 years of experience with high-resolution imaging technology. This paper shows the institute's scientific results of the leading-edge detector design CMOS in a TDI (Time Delay and Integration) architecture. This project includes the technological design of future high or multi-spectral resolution spaceborne instruments and the possibility of higher integration. DLR OS and the Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) in Duisburg were driving the technology of new detectors and the FPA design for future projects, new manufacturing accuracy and on-chip processing capability in order to keep pace with the ambitious scientific and user requirements. In combination with the engineering research, the current generation of space borne sensor systems is focusing on VIS/NIR high spectral resolution to meet the requirements on earth and planetary observation systems. The combination of large-swath and high-spectral resolution with intelligent synchronization control, fast-readout ADC (analog digital converter) chains and new focal-plane concepts opens the door to new remote-sensing and smart deep-space instruments. The paper gives an overview of the detector development status and verification program at DLR, as well as of new control possibilities for CMOS-TDI detectors in synchronization control mode.

  10. A CMOS smart temperature and humidity sensor with combined readout.

    PubMed

    Eder, Clemens; Valente, Virgilio; Donaldson, Nick; Demosthenous, Andreas

    2014-01-01

    A fully-integrated complementary metal-oxide semiconductor (CMOS) sensor for combined temperature and humidity measurements is presented. The main purpose of the device is to monitor the hermeticity of micro-packages for implanted integrated circuits and to ensure their safe operation by monitoring the operating temperature and humidity on-chip. The smart sensor has two modes of operation, in which either the temperature or humidity is converted into a digital code representing a frequency ratio between two oscillators. This ratio is determined by the ratios of the timing capacitances and bias currents in both oscillators. The reference oscillator is biased by a current whose temperature dependency is complementary to the proportional to absolute temperature (PTAT) current. For the temperature measurement, this results in an exceptional normalized sensitivity of about 0.77%/°C at the accepted expense of reduced linearity. The humidity sensor is a capacitor, whose value varies linearly with relative humidity (RH) with a normalized sensitivity of 0.055%/% RH. For comparison, two versions of the humidity sensor with an area of either 0.2 mm2 or 1.2 mm2 were fabricated in a commercial 0.18 μm CMOS process. The on-chip readout electronics operate from a 5 V power supply and consume a current of approximately 85 µA. PMID:25230305

  11. Smart CMOS image sensor for lightning detection and imaging.

    PubMed

    Rolando, Sébastien; Goiffon, Vincent; Magnan, Pierre; Corbière, Franck; Molina, Romain; Tulet, Michel; Bréart-de-Boisanger, Michel; Saint-Pé, Olivier; Guiry, Saïprasad; Larnaudie, Franck; Leone, Bruno; Perez-Cuevas, Leticia; Zayer, Igor

    2013-03-01

    We present a CMOS image sensor dedicated to lightning detection and imaging. The detector has been designed to evaluate the potentiality of an on-chip lightning detection solution based on a smart sensor. This evaluation is performed in the frame of the predevelopment phase of the lightning detector that will be implemented in the Meteosat Third Generation Imager satellite for the European Space Agency. The lightning detection process is performed by a smart detector combining an in-pixel frame-to-frame difference comparison with an adjustable threshold and on-chip digital processing allowing an efficient localization of a faint lightning pulse on the entire large format array at a frequency of 1 kHz. A CMOS prototype sensor with a 256×256 pixel array and a 60 μm pixel pitch has been fabricated using a 0.35 μm 2P 5M technology and tested to validate the selected detection approach. PMID:23458812

  12. A CMOS Imager with Focal Plane Compression using Predictive Coding

    NASA Technical Reports Server (NTRS)

    Leon-Salas, Walter D.; Balkir, Sina; Sayood, Khalid; Schemm, Nathan; Hoffman, Michael W.

    2007-01-01

    This paper presents a CMOS image sensor with focal-plane compression. The design has a column-level architecture and it is based on predictive coding techniques for image decorrelation. The prediction operations are performed in the analog domain to avoid quantization noise and to decrease the area complexity of the circuit, The prediction residuals are quantized and encoded by a joint quantizer/coder circuit. To save area resources, the joint quantizerlcoder circuit exploits common circuitry between a single-slope analog-to-digital converter (ADC) and a Golomb-Rice entropy coder. This combination of ADC and encoder allows the integration of the entropy coder at the column level. A prototype chip was fabricated in a 0.35 pm CMOS process. The output of the chip is a compressed bit stream. The test chip occupies a silicon area of 2.60 mm x 5.96 mm which includes an 80 X 44 APS array. Tests of the fabricated chip demonstrate the validity of the design.

  13. Precision of FLEET Velocimetry Using High-speed CMOS Camera Systems

    NASA Technical Reports Server (NTRS)

    Peters, Christopher J.; Danehy, Paul M.; Bathel, Brett F.; Jiang, Naibo; Calvert, Nathan D.; Miles, Richard B.

    2015-01-01

    Femtosecond laser electronic excitation tagging (FLEET) is an optical measurement technique that permits quantitative velocimetry of unseeded air or nitrogen using a single laser and a single camera. In this paper, we seek to determine the fundamental precision of the FLEET technique using high-speed complementary metal-oxide semiconductor (CMOS) cameras. Also, we compare the performance of several different high-speed CMOS camera systems for acquiring FLEET velocimetry data in air and nitrogen free-jet flows. The precision was defined as the standard deviation of a set of several hundred single-shot velocity measurements. Methods of enhancing the precision of the measurement were explored such as digital binning (similar in concept to on-sensor binning, but done in post-processing), row-wise digital binning of the signal in adjacent pixels and increasing the time delay between successive exposures. These techniques generally improved precision; however, binning provided the greatest improvement to the un-intensified camera systems which had low signal-to-noise ratio. When binning row-wise by 8 pixels (about the thickness of the tagged region) and using an inter-frame delay of 65 micro sec, precisions of 0.5 m/s in air and 0.2 m/s in nitrogen were achieved. The camera comparison included a pco.dimax HD, a LaVision Imager scientific CMOS (sCMOS) and a Photron FASTCAM SA-X2, along with a two-stage LaVision High Speed IRO intensifier. Excluding the LaVision Imager sCMOS, the cameras were tested with and without intensification and with both short and long inter-frame delays. Use of intensification and longer inter-frame delay generally improved precision. Overall, the Photron FASTCAM SA-X2 exhibited the best performance in terms of greatest precision and highest signal-to-noise ratio primarily because it had the largest pixels.

  14. Precision of FLEET Velocimetry Using High-Speed CMOS Camera Systems

    NASA Technical Reports Server (NTRS)

    Peters, Christopher J.; Danehy, Paul M.; Bathel, Brett F.; Jiang, Naibo; Calvert, Nathan D.; Miles, Richard B.

    2015-01-01

    Femtosecond laser electronic excitation tagging (FLEET) is an optical measurement technique that permits quantitative velocimetry of unseeded air or nitrogen using a single laser and a single camera. In this paper, we seek to determine the fundamental precision of the FLEET technique using high-speed complementary metal-oxide semiconductor (CMOS) cameras. Also, we compare the performance of several different high-speed CMOS camera systems for acquiring FLEET velocimetry data in air and nitrogen free-jet flows. The precision was defined as the standard deviation of a set of several hundred single-shot velocity measurements. Methods of enhancing the precision of the measurement were explored such as digital binning (similar in concept to on-sensor binning, but done in post-processing), row-wise digital binning of the signal in adjacent pixels and increasing the time delay between successive exposures. These techniques generally improved precision; however, binning provided the greatest improvement to the un-intensified camera systems which had low signal-to-noise ratio. When binning row-wise by 8 pixels (about the thickness of the tagged region) and using an inter-frame delay of 65 microseconds, precisions of 0.5 meters per second in air and 0.2 meters per second in nitrogen were achieved. The camera comparison included a pco.dimax HD, a LaVision Imager scientific CMOS (sCMOS) and a Photron FASTCAM SA-X2, along with a two-stage LaVision HighSpeed IRO intensifier. Excluding the LaVision Imager sCMOS, the cameras were tested with and without intensification and with both short and long inter-frame delays. Use of intensification and longer inter-frame delay generally improved precision. Overall, the Photron FASTCAM SA-X2 exhibited the best performance in terms of greatest precision and highest signal-to-noise ratio primarily because it had the largest pixels.

  15. Flexible packaging and integration of CMOS IC with elastomeric microfluidics

    NASA Astrophysics Data System (ADS)

    Zhang, Bowei; Dong, Quan; Korman, Can E.; Li, Zhenyu; Zaghloul, Mona E.

    2013-05-01

    We have demonstrated flexible packaging and integration of CMOS IC chips with PDMS microfluidics. Microfluidic channels are used to deliver both liquid samples and liquid metals to the CMOS die. The liquid metals are used to realize electrical interconnects to the CMOS chip. As a demonstration we integrated a CMOS magnetic sensor die and matched PDMS microfluidic channels in a flexible package. The packaged system is fully functional under 3cm bending radius. The flexible integration of CMOS ICs with microfluidics enables previously unavailable flexible CMOS electronic systems with fluidic manipulation capabilities, which hold great potential for wearable health monitoring, point-of-care diagnostics and environmental sensing.

  16. CMOS APS detector characterization for quantitative X-ray imaging

    NASA Astrophysics Data System (ADS)

    Endrizzi, Marco; Oliva, Piernicola; Golosio, Bruno; Delogu, Pasquale

    2013-03-01

    An X-ray Imaging detector based on CMOS Active Pixel Sensor and structured scintillator is characterized for quantitative X-ray imaging in the energy range 11-30 keV. Linearity, dark noise, spatial resolution and flat-field correction are the characteristics of the detector subject of investigation. The detector response, in terms of mean Analog-to-Digital Unit and noise, is modeled as a function of the energy and intensity of the X-rays. The model is directly tested using monochromatic X-ray beams and it is also indirectly validated by means of polychromatic X-ray-tube spectra. Such a characterization is suitable for quantitative X-ray imaging and the model can be used in simulation studies that take into account the actual performance of the detector.

  17. A new visible watermarking technique applied to CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Yu, Pingping; Shang, Yan; Li, Chunming

    2013-10-01

    This paper presents a new visible watermarking solution for CMOS image sensor which can enhance secure features of captured images. Visible watermarks are embedded in the Bayer format image data and can be transferred by the subsequent interpolation process. A piecewise function is setup based on the gray scale resolution characteristics of human eyes. Watermark stretch factor can be adaptively chosen according to the gray value of the current pixel. The advantage of this algorithm is that the watermark has the same visibility in different image brightness region. A number of color images have been used to test the method. In order to check the robustness of watermarked images, we conducted adding noise and filtering experiments, results show that the visibility of watermark is also good after the experiments. The approach allows a digital watermark to be embedded in an image immediately upon its capture, before leaving the imaging chip.

  18. CMOS Imaging Detectors as X-ray Detectors for Synchrotron Radiation Experiments

    SciTech Connect

    Yagi, Naoto; Uesugi, Kentaro; Inoue, Katsuaki

    2004-05-12

    CMOS imagers are matrix-addressed photodiode arrays, which have been utilized in devices such as commercially available digital cameras. The pixel size of CMOS imagers is usually larger than that of CCD and smaller than that of TFT, giving them a unique position. Although CMOS x-ray imaging devices have already become commercially available, they have not been used as an x-ray area detector in synchrotron radiation experiments. We tested performance of a CMOS detector from Rad-icon (Shad-o-Box1024) in medical imaging, small-angle scattering, and protein crystallography experiments. It has pixels of 0.048 mm square, read-out time of 0.45 sec, 12-bit ADC, and requires a frame grabber for image acquisition. The detection area is 5-cm square. It uses a Kodak Min-R scintillator screen as a phosphor. The sensitivity to x-rays with an energy less than 15 keV was low because of the thick window materials. Since the readout noise is high, the dynamic range is limited to 2000. The biggest advantages of this detector are cost-effectiveness (about 10,000 US dollars) and compactness (thickness < 3 cm, weight < 2 kg)

  19. On-Wafer Measurement of a Silicon-Based CMOS VCO at 324 GHz

    NASA Technical Reports Server (NTRS)

    Samoska, Lorene; Man Fung, King; Gaier, Todd; Huang, Daquan; Larocca, Tim; Chang, M. F.; Campbell, Richard; Andrews, Michael

    2008-01-01

    The world s first silicon-based complementary metal oxide/semiconductor (CMOS) integrated-circuit voltage-controlled oscillator (VCO) operating in a frequency range around 324 GHz has been built and tested. Concomitantly, equipment for measuring the performance of this oscillator has been built and tested. These accomplishments are intermediate steps in a continuing effort to develop low-power-consumption, low-phase-noise, electronically tunable signal generators as local oscillators for heterodyne receivers in submillimeter-wavelength (frequency > 300 GHz) scientific instruments and imaging systems. Submillimeter-wavelength imaging systems are of special interest for military and law-enforcement use because they could, potentially, be used to detect weapons hidden behind clothing and other opaque dielectric materials. In comparison with prior submillimeter- wavelength signal generators, CMOS VCOs offer significant potential advantages, including great reductions in power consumption, mass, size, and complexity. In addition, there is potential for on-chip integration of CMOS VCOs with other CMOS integrated circuitry, including phase-lock loops, analog- to-digital converters, and advanced microprocessors.

  20. A 10-bit column-parallel cyclic ADC for high-speed CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Ye, Han; Quanliang, Li; Cong, Shi; Nanjian, Wu

    2013-08-01

    This paper presents a high-speed column-parallel cyclic analog-to-digital converter (ADC) for a CMOS image sensor. A correlated double sampling (CDS) circuit is integrated in the ADC, which avoids a stand-alone CDS circuit block. An offset cancellation technique is also introduced, which reduces the column fixed-pattern noise (FPN) effectively. One single channel ADC with an area less than 0.02 mm2 was implemented in a 0.13 μm CMOS image sensor process. The resolution of the proposed ADC is 10-bit, and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively. The power consumption from 3.3 V supply is only 0.66 mW. An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels. The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors.

  1. X-ray characterization of CMOS imaging detector with high resolution for fluoroscopic imaging application

    NASA Astrophysics Data System (ADS)

    Cha, Bo Kyung; Kim, Cho Rong; Jeon, Seongchae; Kim, Ryun Kyung; Seo, Chang-Woo; Yang, Keedong; Heo, Duchang; Lee, Tae-Bum; Shin, Min-Seok; Kim, Jong-Boo; Kwon, Oh-Kyung

    2013-12-01

    This paper introduces complementary metal-oxide semiconductor (CMOS) active pixel sensor (APS)-based X-ray imaging detectors with high spatial resolution for medical imaging application. In this study, our proposed X-ray CMOS imaging sensor has been fabricated by using a 0.35 μm 1 Poly 4 Metal CMOS process. The pixel size is 100 μm×100 μm and the pixel array format is 24×96 pixels, which provide a field-of-view (FOV) of 9.6 mm×2.4 mm. The 14.3-bit extend counting analog-to digital converter (ADC) with built-in binning mode was used to reduce the area and simultaneously improve the image resolution. Both thallium-doped CsI (CsI:Tl) and Gd2O2S:Tb scintillator screens were used as converters for incident X-rays to visible light photons. The optical property and X-ray imaging characterization such as X-ray to light response as a function of incident X-ray exposure dose, spatial resolution and X-ray images of objects were measured under different X-ray energy conditions. The measured results suggest that our developed CMOS-based X-ray imaging detector has the potential for fluoroscopic imaging and cone-beam computed tomography (CBCT) imaging applications.

  2. Development of a lens-coupled CMOS detector for an X-ray inspection system

    NASA Astrophysics Data System (ADS)

    Kim, Ho Kyung; Ahn, Jung Keun; Cho, Gyuseong

    2005-06-01

    A digital X-ray imaging detector based on a complementary metal-oxide-semiconductor (CMOS) image sensor has been developed for X-ray non-destructive inspection applications. This is a cost-effective solution because of the availability of cheap commercial standard CMOS image sensors. The detector configuration adopts an indirect X-ray detection method by using scintillation material and lens assembly. As a feasibility test of the developed lens-coupled CMOS detector as an X-ray inspection system, we have acquired X-ray projection images under a variety of imaging conditions. The results show that the projected image is reasonably acceptable in typical non-destructive testing (NDT). However, the developed detector may not be appropriate for laminography due to a low light-collection efficiency of lens assembly. In this paper, construction of the lens-coupled CMOS detector and its specifications are described, and the experimental results are presented. Using the analysis of quantum accounting diagram, inefficiency of the lens-coupling method is discussed.

  3. Single-Photon Avalanche Diodes (SPAD) in CMOS 0.35 μm technology

    NASA Astrophysics Data System (ADS)

    Pellion, D.; Jradi, K.; Brochard, N.; Prêle, D.; Ginhac, D.

    2015-07-01

    Some decades ago single photon detection used to be the terrain of photomultiplier tube (PMT), thanks to its characteristics of sensitivity and speed. However, PMT has several disadvantages such as low quantum efficiency, overall dimensions, and cost, making them unsuitable for compact design of integrated systems. So, the past decade has seen a dramatic increase in interest in new integrated single-photon detectors called Single-Photon Avalanche Diodes (SPAD) or Geiger-mode APD. SPAD are working in avalanche mode above the breakdown level. When an incident photon is captured, a very fast avalanche is triggered, generating an easily detectable current pulse. This paper discusses SPAD detectors fabricated in a standard CMOS technology featuring both single-photon sensitivity, and excellent timing resolution, while guaranteeing a high integration. In this work, we investigate the design of SPAD detectors using the AMS 0.35 μm CMOS Opto technology. Indeed, such standard CMOS technology allows producing large surface (few mm2) of single photon sensitive detectors. Moreover, SPAD in CMOS technologies could be associated to electronic readout such as active quenching, digital to analog converter, memories and any specific processing required to build efficient calorimeters1

  4. Overview of CMOS process and design options for image sensor dedicated to space applications

    NASA Astrophysics Data System (ADS)

    Martin-Gonthier, P.; Magnan, P.; Corbiere, F.

    2005-10-01

    With the growth of huge volume markets (mobile phones, digital cameras...) CMOS technologies for image sensor improve significantly. New process flows appear in order to optimize some parameters such as quantum efficiency, dark current, and conversion gain. Space applications can of course benefit from these improvements. To illustrate this evolution, this paper reports results from three technologies that have been evaluated with test vehicles composed of several sub arrays designed with some space applications as target. These three technologies are CMOS standard, improved and sensor optimized process in 0.35μm generation. Measurements are focussed on quantum efficiency, dark current, conversion gain and noise. Other measurements such as Modulation Transfer Function (MTF) and crosstalk are depicted in [1]. A comparison between results has been done and three categories of CMOS process for image sensors have been listed. Radiation tolerance has been also studied for the CMOS improved process in the way of hardening the imager by design. Results at 4, 15, 25 and 50 krad prove a good ionizing dose radiation tolerance applying specific techniques.

  5. A Radiation Hardened by Design CMOS ASIC for Thermopile Readouts

    NASA Technical Reports Server (NTRS)

    Quilligan, G.; Aslam, S.; DuMonthier, J.

    2012-01-01

    A radiation hardened by design (RHBD) mixed-signal application specific integrated circuit (ASIC) has been designed for a thermopile readout for operation in the harsh Jovian orbital environment. The multi-channel digitizer (MCD) ASIC includes 18 low noise amplifier channels which have tunable gain/filtering coefficients, a 16-bit sigma-delta analog-digital converter (SDADC) and an on-chip controller. The 18 channels, SDADC and controller were designed to operate with immunity to single event latchup (SEL) and to at least 10 Mrad total ionizing dose (TID). The ASIC also contains a radiation tolerant 16-bit 20 MHz Nyquist ADC for general purpose instrumentation digitizer needs. The ASIC is currently undergoing fabrication in a commercial 180 nm CMOS process. Although this ASIC was designed specifically for the harsh radiation environment of the NASA led JEO mission it is suitable for integration into instrumentation payloads 011 the ESA JUICE mission where the radiation hardness requirements are slightly less stringent.

  6. High Rate Digital Demodulator ASIC

    NASA Technical Reports Server (NTRS)

    Ghuman, Parminder; Sheikh, Salman; Koubek, Steve; Hoy, Scott; Gray, Andrew

    1998-01-01

    The architecture of High Rate (600 Mega-bits per second) Digital Demodulator (HRDD) ASIC capable of demodulating BPSK and QPSK modulated data is presented in this paper. The advantages of all-digital processing include increased flexibility and reliability with reduced reproduction costs. Conventional serial digital processing would require high processing rates necessitating a hardware implementation in other than CMOS technology such as Gallium Arsenide (GaAs) which has high cost and power requirements. It is more desirable to use CMOS technology with its lower power requirements and higher gate density. However, digital demodulation of high data rates in CMOS requires parallel algorithms to process the sampled data at a rate lower than the data rate. The parallel processing algorithms described here were developed jointly by NASA's Goddard Space Flight Center (GSFC) and the Jet Propulsion Laboratory (JPL). The resulting all-digital receiver has the capability to demodulate BPSK, QPSK, OQPSK, and DQPSK at data rates in excess of 300 Mega-bits per second (Mbps) per channel. This paper will provide an overview of the parallel architecture and features of the HRDR ASIC. In addition, this paper will provide an over-view of the implementation of the hardware architectures used to create flexibility over conventional high rate analog or hybrid receivers. This flexibility includes a wide range of data rates, modulation schemes, and operating environments. In conclusion it will be shown how this high rate digital demodulator can be used with an off-the-shelf A/D and a flexible analog front end, both of which are numerically computer controlled, to produce a very flexible, low cost high rate digital receiver.

  7. Color calibration of a CMOS digital camera for mobile imaging

    NASA Astrophysics Data System (ADS)

    Eliasson, Henrik

    2010-01-01

    As white balance algorithms employed in mobile phone cameras become increasingly sophisticated by using, e.g., elaborate white-point estimation methods, a proper color calibration is necessary. Without such a calibration, the estimation of the light source for a given situation may go wrong, giving rise to large color errors. At the same time, the demands for efficiency in the production environment require the calibration to be as simple as possible. Thus it is important to find the correct balance between image quality and production efficiency requirements. The purpose of this work is to investigate camera color variations using a simple model where the sensor and IR filter are specified in detail. As input to the model, spectral data of the 24-color Macbeth Colorchecker was used. This data was combined with the spectral irradiance of mainly three different light sources: CIE A, D65 and F11. The sensor variations were determined from a very large population from which 6 corner samples were picked out for further analysis. Furthermore, a set of 100 IR filters were picked out and measured. The resulting images generated by the model were then analyzed in the CIELAB space and color errors were calculated using the ΔE94 metric. The results of the analysis show that the maximum deviations from the typical values are small enough to suggest that a white balance calibration is sufficient. Furthermore, it is also demonstrated that the color temperature dependence is small enough to justify the use of only one light source in a production environment.

  8. Nanopore-CMOS Interfaces for DNA Sequencing.

    PubMed

    Magierowski, Sebastian; Huang, Yiyun; Wang, Chengjie; Ghafar-Zadeh, Ebrahim

    2016-01-01

    DNA sequencers based on nanopore sensors present an opportunity for a significant break from the template-based incumbents of the last forty years. Key advantages ushered by nanopore technology include a simplified chemistry and the ability to interface to CMOS technology. The latter opportunity offers substantial promise for improvement in sequencing speed, size and cost. This paper reviews existing and emerging means of interfacing nanopores to CMOS technology with an emphasis on massively-arrayed structures. It presents this in the context of incumbent DNA sequencing techniques, reviews and quantifies nanopore characteristics and models and presents CMOS circuit methods for the amplification of low-current nanopore signals in such interfaces. PMID:27509529

  9. Characterization and reliability of CMOS microstructures

    NASA Astrophysics Data System (ADS)

    Fedder, Gary K.; Blanton, Ronald D. S.

    1999-08-01

    This paper provides an overview of high-aspect-ratio CMOS micromachining, focusing on materials characterization, reliability, and fault analysis. Composite microstrutural beam widths and gaps down to 1.2 micrometers are etched out of conventional CMOS dielectric, aluminum, and gate-polysilicon thin films using post-CMOS dry etching for both structural sidewall definition and for release from the substrate. Differences in stress between the multiple metal and dielectric layers cause vertical stress gradients and curl, while misalignment between layers causes lateral stress gradients and curl. Cracking is induced in a resonant fatigue structures at 620 MPa of repetitive stress after over 50 million cycles. Beams have withstood over 1.3 billion cycles at 124 MPa stress levels induced by electrostatic actuation. Failures due to process defects are classified according to the geometrical features of the defective structures. Relative probability of occurrence of each defect type is extracted from the process simulation results.

  10. High-temperature Complementary Metal Oxide Semiconductors (CMOS)

    NASA Technical Reports Server (NTRS)

    Mcbrayer, J. D.

    1981-01-01

    The results of an investigation into the possibility of using complementary metal oxide semiconductor (CMOS) technology for high temperature electronics are presented. A CMOS test chip was specifically developed as the test bed. This test chip incorporates CMOS transistors that have no gate protection diodes; these diodes are the major cause of leakage in commercial devices.

  11. Resistor Extends Life Of Battery In Clocked CMOS Circuit

    NASA Technical Reports Server (NTRS)

    Wells, George H., Jr.

    1991-01-01

    Addition of fixed resistor between battery and clocked complementary metal oxide/semiconductor (CMOS) circuit reduces current drawn from battery. Basic idea to minimize current drawn from battery by operating CMOS circuit at lowest possible current consistent with use of simple, fixed off-the-shelf components. Prolongs lives of batteries in such low-power CMOS circuits as watches and calculators.

  12. CMOS readout integrated circuit involving pixel-level ADC for microbolometer FPAs

    NASA Astrophysics Data System (ADS)

    Hwang, C. H.; Kwon, I. W.; Lee, Y. S.; Lee, H. C.

    2008-04-01

    The function of most readout integrated circuits (ROIC) for microbolometer focal plane arrays (FPAs) is supplying a bias voltage to a microbolometer of each pixel, integrating the current of a microbolometer, and transferring the signals from pixels to the output of a chip. However, the scale down of CMOS technology allows the integration of other functions. In this paper, we proposed a CMOS ROIC involving a pixel-level analog-to-digital converter (ADC) for 320 × 240 microbolometer FPAs. Such integration would improve the performance of a ROIC at the reduced system cost and power consumption. The noise performance of a microbolometer is improved by using the pixelwise readout structure because integration time can be increased up to 1ms. A Pixel circuit is consisted of a background skimming circuit, a differential amplifier, an integration capacitor and a 10-bit DRAM. First, the microbolometer current is integrated for 1ms after the skimming current correction. The differential amplifier operates as an op-Amp and the integration capacitor makes negative feedback loop between an output and a negative input of the op-Amp. And then, the integrated signal voltage is converted to digital signals using a modified single slope ADC in a pixel when the differential amplifier operates as a comparator and the 10-bit DRAM stores values of a counter. This readout circuit is designed and fabricated using a standard 0.35μm 2-poly 3-metal CMOS technology.

  13. End-of-fabrication CMOS process monitor

    NASA Technical Reports Server (NTRS)

    Buehler, M. G.; Allen, R. A.; Blaes, B. R.; Hannaman, D. J.; Lieneweg, U.; Lin, Y.-S.; Sayah, H. R.

    1990-01-01

    A set of test 'modules' for verifying the quality of a complementary metal oxide semiconductor (CMOS) process at the end of the wafer fabrication is documented. By electrical testing of specific structures, over thirty parameters are collected characterizing interconnects, dielectrics, contacts, transistors, and inverters. Each test module contains a specification of its purpose, the layout of the test structure, the test procedures, the data reduction algorithms, and exemplary results obtained from 3-, 2-, or 1.6-micrometer CMOS/bulk processes. The document is intended to establish standard process qualification procedures for Application Specific Integrated Circuits (ASIC's).

  14. Ultra low power CMOS technology

    NASA Technical Reports Server (NTRS)

    Burr, J.; Peterson, A.

    1991-01-01

    This paper discusses the motivation, opportunities, and problems associated with implementing digital logic at very low voltages, including the challenge of making use of the available real estate in 3D multichip modules, energy requirements of very large neural networks, energy optimization metrics and their impact on system design, modeling problems, circuit design constraints, possible fabrication process modifications to improve performance, and barriers to practical implementation.

  15. Low-power LVDS for digital readout circuits

    NASA Astrophysics Data System (ADS)

    Yazici, Melik; Kayahan, Huseyin; Ceylan, Omer; Shafique, Atia; Gurbuz, Yasar

    2015-06-01

    This paper presents a mixed-signal LVDS driver in 90 nm CMOS technology. The designed LVDS core is to be used as a data link between Infrared Focal Plane Array (IRFPA) detector end and microprocessor input. Parallel data from 220 pixels of IRFPA is serialized by LVDS driver and read out to microprocessor. It also offers a reduced power consumption rate, high data transmission speed and utilizes dense placement of devices for area efficiency. The entire output driver circuit including input buffer draws 5mA while the output swing is 500mV at power supply of 1.2V for data rate of 6.4Gbps.Total LVDS chip area is 0.79 mm2. Due to these features, the designed LVDS driver is suitable for purposes such as portable, high-speed imaging.

  16. A High-Speed CMOS Image Sensor with Global Electronic Shutter Pixels Using Pinned Diodes

    NASA Astrophysics Data System (ADS)

    Yasutomi, Keita; Tamura, Toshihiro; Furuta, Masanori; Itoh, Shinya; Kawahito, Shoji

    This paper describes a high-speed CMOS image sensor with a new type of global electronic shutter pixel. A global electronic shutter is necessary for imaging fast-moving objects without motion blur or distortion. The proposed pixel has two potential wells with pinned diode structure for two-stage charge transfer that enables a global electronic shuttering and reset noise canceling. A prototype high-speed image sensor fabricated in 0.18μm standard CMOS image sensor process consists of the proposed pixel array, 12-bit column-parallel cyclic ADC arrays and 192-channel digital outputs. The sensor achieves a good linearity at low-light intensity, demonstrating the perfect charge transfer between two pinned diodes. The input referred noise of the proposed pixel is measured to be 6.3 e-.

  17. A CMOS detection chip for amperometric sensors with chopper stabilized incremental ΔΣ ADC

    NASA Astrophysics Data System (ADS)

    Min, Chen; Yuntao, Liu; Jingbo, Xiao; Jie, Chen

    2016-06-01

    This paper presents a low noise complimentary metal–oxide-semiconductor (CMOS) detection chip for amperometric electrochemical sensors. In order to effectively remove the input offset of the cascaded integrators and the low frequency noise in the modulator, a novel offset cancellation chopping scheme was proposed in the Incremental ΔΣ analog to digital converter (IADC). A novel low power potentiostat was employed in this chip to provide the biasing voltage for the sensor while mirroring the sensor current out for detection. The chip communicates with FPGA through standard built in I2C interface and SPI bus. Fabricated in 0.18-μm CMOS process, this chip detects current signal with high accuracy and high linearity. A prototype microsystem was produced to verify the detection chip performance with current input as well as micro-sensors. Project supported by the State Key Development Program for Basic Research of China (No. 2015CB352100).

  18. Radiation Tolerance of 65nm CMOS Transistors

    DOE PAGESBeta

    Krohn, M.; Bentele, B.; Christian, D. C.; Cumalat, J. P.; Deptuch, G.; Fahim, F.; Hoff, J.; Shenai, A.; Wagner, S. R.

    2015-12-11

    We report on the effects of ionizing radiation on 65 nm CMOS transistors held at approximately -20°C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature.

  19. SEU hardening of CMOS memory circuit

    NASA Technical Reports Server (NTRS)

    Whitaker, S.; Canaris, J.; Liu, K.

    1990-01-01

    This paper reports a design technique to harden CMOS memory circuits against Single Event Upset (SEU) in the space environment. A RAM cell and Flip Flop design are presented to demonstrate the method. The Flip Flop was used in the control circuitry for a Reed Solomon encoder designed for the Space Station.

  20. Low energy CMOS for space applications

    NASA Technical Reports Server (NTRS)

    Panwar, Ramesh; Alkalaj, Leon

    1992-01-01

    The current focus of NASA's space flight programs reflects a new thrust towards smaller, less costly, and more frequent space missions, when compared to missions such as Galileo, Magellan, or Cassini. Recently, the concept of a microspacecraft was proposed. In this concept, a small, compact spacecraft that weighs tens of kilograms performs focused scientific objectives such as imaging. Similarly, a Mars Lander micro-rover project is under study that will allow miniature robots weighing less than seven kilograms to explore the Martian surface. To bring the microspacecraft and microrover ideas to fruition, one will have to leverage compact 3D multi-chip module-based multiprocessors (MCM) technologies. Low energy CMOS will become increasingly important because of the thermodynamic considerations in cooling compact 3D MCM implementations and also from considerations of the power budget for space applications. In this paper, we show how the operating voltage is related to the threshold voltage of the CMOS transistors for accomplishing a task in VLSI with minimal energy. We also derive expressions for the noise margins at the optimal operating point. We then look at a low voltage CMOS (LVCMOS) technology developed at Stanford University which improves the power consumption over conventional CMOS by a couple of orders of magnitude and consider the suitability of the technology for space applications by characterizing its SEU immunity.

  1. Low power SEU immune CMOS memory circuits

    NASA Technical Reports Server (NTRS)

    Liu, M. N.; Whitaker, Sterling

    1992-01-01

    The authors report a design improvement for CMOS static memory circuits hardened against single event upset (SEU) using a recently proposed logic/circuit design technique. This improvement drastically reduces static power consumption, reduces the number of transistors required in a D flip-flop design, and eliminates the possibility of capturing an upset state in the slave section during a clock transition.

  2. Fully CMOS-compatible titanium nitride nanoantennas

    NASA Astrophysics Data System (ADS)

    Briggs, Justin A.; Naik, Gururaj V.; Petach, Trevor A.; Baum, Brian K.; Goldhaber-Gordon, David; Dionne, Jennifer A.

    2016-02-01

    CMOS-compatible fabrication of plasmonic materials and devices will accelerate the development of integrated nanophotonics for information processing applications. Using low-temperature plasma-enhanced atomic layer deposition (PEALD), we develop a recipe for fully CMOS-compatible titanium nitride (TiN) that is plasmonic in the visible and near infrared. Films are grown on silicon, silicon dioxide, and epitaxially on magnesium oxide substrates. By optimizing the plasma exposure per growth cycle during PEALD, carbon and oxygen contamination are reduced, lowering undesirable loss. We use electron beam lithography to pattern TiN nanopillars with varying diameters on silicon in large-area arrays. In the first reported single-particle measurements on plasmonic TiN, we demonstrate size-tunable darkfield scattering spectroscopy in the visible and near infrared regimes. The optical properties of this CMOS-compatible material, combined with its high melting temperature and mechanical durability, comprise a step towards fully CMOS-integrated nanophotonic information processing.

  3. A fail-safe CMOS logic gate

    NASA Technical Reports Server (NTRS)

    Bobin, V.; Whitaker, S.

    1990-01-01

    This paper reports a design technique to make Complex CMOS Gates fail-safe for a class of faults. Two classes of faults are defined. The fail-safe design presented has limited fault-tolerance capability. Multiple faults are also covered.

  4. CMOS preamplifiers for detectors large and small

    SciTech Connect

    O`Connor, P.

    1997-12-31

    We describe four CMOS preamplifiers developed for multiwire proportional chambers (MWPC) and silicon drift detectors (SDD) covering a capacitance range from 150 pF to 0.15 pF. Circuit techniques to optimize noise performance, particularly in the low-capacitance regime, are discussed.

  5. Low energy CMOS for space applications

    NASA Astrophysics Data System (ADS)

    Panwar, Ramesh; Alkalaj, Leon

    The current focus of NASA's space flight programs reflects a new thrust towards smaller, less costly, and more frequent space missions, when compared to missions such as Galileo, Magellan, or Cassini. Recently, the concept of a microspacecraft was proposed. In this concept, a small, compact spacecraft that weighs tens of kilograms performs focused scientific objectives such as imaging. Similarly, a Mars Lander micro-rover project is under study that will allow miniature robots weighing less than seven kilograms to explore the Martian surface. To bring the microspacecraft and microrover ideas to fruition, one will have to leverage compact 3D multi-chip module-based multiprocessors (MCM) technologies. Low energy CMOS will become increasingly important because of the thermodynamic considerations in cooling compact 3D MCM implementations and also from considerations of the power budget for space applications. In this paper, we show how the operating voltage is related to the threshold voltage of the CMOS transistors for accomplishing a task in VLSI with minimal energy. We also derive expressions for the noise margins at the optimal operating point. We then look at a low voltage CMOS (LVCMOS) technology developed at Stanford University which improves the power consumption over conventional CMOS by a couple of orders of magnitude and consider the suitability of the technology for space applications by characterizing its SEU immunity.

  6. Low-Power SOI CMOS Transceiver

    NASA Technical Reports Server (NTRS)

    Fujikawa, Gene (Technical Monitor); Cheruiyot, K.; Cothern, J.; Huang, D.; Singh, S.; Zencir, E.; Dogan, N.

    2003-01-01

    The work aims at developing a low-power Silicon on Insulator Complementary Metal Oxide Semiconductor (SOI CMOS) Transceiver for deep-space communications. RF Receiver must accomplish the following tasks: (a) Select the desired radio channel and reject other radio signals, (b) Amplify the desired radio signal and translate them back to baseband, and (c) Detect and decode the information with Low BER. In order to minimize cost and achieve high level of integration, receiver architecture should use least number of external filters and passive components. It should also consume least amount of power to minimize battery cost, size, and weight. One of the most stringent requirements for deep-space communication is the low-power operation. Our study identified that two candidate architectures listed in the following meet these requirements: (1) Low-IF receiver, (2) Sub-sampling receiver. The low-IF receiver uses minimum number of external components. Compared to Zero-IF (Direct conversion) architecture, it has less severe offset and flicker noise problems. The Sub-sampling receiver amplifies the RF signal and samples it using track-and-hold Subsampling mixer. These architectures provide low-power solution for the short- range communications missions on Mars. Accomplishments to date include: (1) System-level design and simulation of a Double-Differential PSK receiver, (2) Implementation of Honeywell SOI CMOS process design kit (PDK) in Cadence design tools, (3) Design of test circuits to investigate relationships between layout techniques, geometry, and low-frequency noise in SOI CMOS, (4) Model development and verification of on-chip spiral inductors in SOI CMOS process, (5) Design/implementation of low-power low-noise amplifier (LNA) and mixer for low-IF receiver, and (6) Design/implementation of high-gain LNA for sub-sampling receiver. Our initial results show that substantial improvement in power consumption is achieved using SOI CMOS as compared to standard CMOS

  7. High resolution, high bandwidth global shutter CMOS area scan sensors

    NASA Astrophysics Data System (ADS)

    Faramarzpour, Naser; Sonder, Matthias; Li, Binqiao

    2013-10-01

    Global shuttering, sometimes also known as electronic shuttering, enables the use of CMOS sensors in a vast range of applications. Teledyne DALSA Global shutter sensors are able to integrate light synchronously across millions of pixels with microsecond accuracy. Teledyne DALSA offers 5 transistor global shutter pixels in variety of resolutions, pitches and noise and full-well combinations. One of the recent generations of these pixels is implemented in 12 mega pixel area scan device at 6 um pitch and that images up to 70 frames per second with 58 dB dynamic range. These square pixels include microlens and optional color filters. These sensors also offer exposure control, anti-blooming and high dynamic range operation by introduction of a drain and a PPD reset gate to the pixel. The state of the art sense node design of Teledyne DALSA's 5T pixel offers exceptional shutter rejection ratio. The architecture is consistent with the requirements to use stitching to achieve very large area scan devices. Parallel or serial digital output is provided on these sensors using on-chip, column-wise analog to digital converters. Flexible ADC bit depth combined with windowing (adjustable region of interest, ROI) allows these sensors to run with variety of resolution/bandwidth combinations. The low power, state of the art LVDS I/O technology allows for overall power consumptions of less than 2W at full performance conditions.

  8. CMOS Image Sensor with a Built-in Lane Detector.

    PubMed

    Hsiao, Pei-Yung; Cheng, Hsien-Chein; Huang, Shih-Shinh; Fu, Li-Chen

    2009-01-01

    This work develops a new current-mode mixed signal Complementary Metal-Oxide-Semiconductor (CMOS) imager, which can capture images and simultaneously produce vehicle lane maps. The adopted lane detection algorithm, which was modified to be compatible with hardware requirements, can achieve a high recognition rate of up to approximately 96% under various weather conditions. Instead of a Personal Computer (PC) based system or embedded platform system equipped with expensive high performance chip of Reduced Instruction Set Computer (RISC) or Digital Signal Processor (DSP), the proposed imager, without extra Analog to Digital Converter (ADC) circuits to transform signals, is a compact, lower cost key-component chip. It is also an innovative component device that can be integrated into intelligent automotive lane departure systems. The chip size is 2,191.4 × 2,389.8 μm, and the package uses 40 pin Dual-In-Package (DIP). The pixel cell size is 18.45 × 21.8 μm and the core size of photodiode is 12.45 × 9.6 μm; the resulting fill factor is 29.7%. PMID:22573983

  9. A CMOS Neural Interface for a Multichannel Vestibular Prosthesis.

    PubMed

    Hageman, Kristin N; Kalayjian, Zaven K; Tejada, Francisco; Chiang, Bryce; Rahman, Mehdi A; Fridman, Gene Y; Dai, Chenkai; Pouliquen, Philippe O; Georgiou, Julio; Della Santina, Charles C; Andreou, Andreas G

    2016-04-01

    We present a high-voltage CMOS neural-interface chip for a multichannel vestibular prosthesis (MVP) that measures head motion and modulates vestibular nerve activity to restore vision- and posture-stabilizing reflexes. This application specific integrated circuit neural interface (ASIC-NI) chip was designed to work with a commercially available microcontroller, which controls the ASIC-NI via a fast parallel interface to deliver biphasic stimulation pulses with 9-bit programmable current amplitude via 16 stimulation channels. The chip was fabricated in the ONSemi C5 0.5 micron, high-voltage CMOS process and can accommodate compliance voltages up to 12 V, stimulating vestibular nerve branches using biphasic current pulses up to 1.45±0.06 mA with durations as short as 10 μs/phase. The ASIC-NI includes a dedicated digital-to-analog converter for each channel, enabling it to perform complex multipolar stimulation. The ASIC-NI replaces discrete components that cover nearly half of the 2nd generation MVP (MVP2) printed circuit board, reducing the MVP system size by 48% and power consumption by 17%. Physiological tests of the ASIC-based MVP system (MVP2A) in a rhesus monkey produced reflexive eye movement responses to prosthetic stimulation similar to those observed when using the MVP2. Sinusoidal modulation of stimulus pulse rate from 68-130 pulses per second at frequencies from 0.1 to 5 Hz elicited appropriately-directed slow phase eye velocities ranging in amplitude from 1.9-16.7 °/s for the MVP2 and 2.0-14.2 °/s for the MVP2A. The eye velocities evoked by MVP2 and MVP2A showed no significant difference ( t-test, p=0.34), suggesting that the MVP2A achieves performance at least as good as the larger MVP2. PMID:25974945

  10. A CMOS Neural Interface for a Multichannel Vestibular Prosthesis

    PubMed Central

    Hageman, Kristin N.; Kalayjian, Zaven K.; Tejada, Francisco; Chiang, Bryce; Rahman, Mehdi A.; Fridman, Gene Y.; Dai, Chenkai; Pouliquen, Philippe O.; Georgiou, Julio; Della Santina, Charles C.; Andreou, Andreas G.

    2015-01-01

    We present a high-voltage CMOS neural-interface chip for a multichannel vestibular prosthesis (MVP) that measures head motion and modulates vestibular nerve activity to restore vision- and posture-stabilizing reflexes. This application specific integrated circuit neural interface (ASIC-NI) chip was designed to work with a commercially available microcontroller, which controls the ASIC-NI via a fast parallel interface to deliver biphasic stimulation pulses with 9-bit programmable current amplitude via 16 stimulation channels. The chip was fabricated in the ONSemi C5 0.5 micron, high-voltage CMOS process and can accommodate compliance voltages up to 12 V, stimulating vestibular nerve branches using biphasic current pulses up to 1.45 ± 0.06 mA with durations as short as 10 µs/phase. The ASIC-NI includes a dedicated digital-to-analog converter for each channel, enabling it to perform complex multipolar stimulation. The ASIC-NI replaces discrete components that cover nearly half of the 2nd generation MVP (MVP2) printed circuit board, reducing the MVP system size by 48% and power consumption by 17%. Physiological tests of the ASIC-based MVP system (MVP2A) in a rhesus monkey produced reflexive eye movement responses to prosthetic stimulation similar to those observed when using the MVP2. Sinusoidal modulation of stimulus pulse rate from 68–130 pulses per second at frequencies from 0.1 to 5 Hz elicited appropriately-directed slow phase eye velocities ranging in amplitude from 1.9–16.7°/s for the MVP2 and 2.0–14.2°/s for the MVP2A. The eye velocities evoked by MVP2 and MVP2A showed no significant difference (t-test, p = 0.034), suggesting that the MVP2A achieves performance at least as good as the larger MVP2. PMID:25974945

  11. Performance of digital integrated circuit technologies at very high temperatures

    SciTech Connect

    Prince, J.L.; Draper, B.L.; Rapp, E.A.; Kromberg, J.N.; Fitch, L.T.

    1980-01-01

    Results of investigations of the performance and reliability of digital bipolar and CMOS integrated circuits over the 25 to 340/sup 0/C range are reported. Included in these results are both parametric variation information and analysis of the functional failure mechanisms. Although most of the work was done using commercially available circuits (TTL and CMOS) and test chips from commercially compatible processes, some results of experimental simulations of dielectrically isolated CMOS are also discussed. It was found that commercial Schottky clamped TTL, and dielectrically isolated, low power Schottky-clamped TTL, functioned to junction temperatures in excess of 325/sup 0/C. Standard gold doped TTL functioned only to 250/sup 0/C, while commercial, isolated I/sup 2/L functioned to the range 250/sup 0/C to 275/sup 0/C. Commercial junction isolated CMOS, buffered and unbuffered, functioned to the range 280/sup 0/C to 310/sup 0/C/sup +/, depending on the manufacturer. Experimental simulations of simple dielectrically isolated CMOS integrated circuits, fabricated with heavier doping levels than normal, functioned to temperatures in excess of 340/sup 0/C. High temperature life testing of experimental, silicone-encapsulated simple TTL and CMOS integrated circuits have shown no obvious life limiting problems to date. No barrier to reliable functionality of TTL bipolar or CMOS integrated ciruits at temperatures in excess of 300/sup 0/C has been found.

  12. An Analog Gamma Correction Scheme for High Dynamic Range CMOS Logarithmic Image Sensors

    PubMed Central

    Cao, Yuan; Pan, Xiaofang; Zhao, Xiaojin; Wu, Huisi

    2014-01-01

    In this paper, a novel analog gamma correction scheme with a logarithmic image sensor dedicated to minimize the quantization noise of the high dynamic applications is presented. The proposed implementation exploits a non-linear voltage-controlled-oscillator (VCO) based analog-to-digital converter (ADC) to perform the gamma correction during the analog-to-digital conversion. As a result, the quantization noise does not increase while the same high dynamic range of logarithmic image sensor is preserved. Moreover, by combining the gamma correction with the analog-to-digital conversion, the silicon area and overall power consumption can be greatly reduced. The proposed gamma correction scheme is validated by the reported simulation results and the experimental results measured for our designed test structure, which is fabricated with 0.35 μm standard complementary-metal-oxide-semiconductor (CMOS) process. PMID:25517692

  13. An analog gamma correction scheme for high dynamic range CMOS logarithmic image sensors.

    PubMed

    Cao, Yuan; Pan, Xiaofang; Zhao, Xiaojin; Wu, Huisi

    2014-01-01

    In this paper, a novel analog gamma correction scheme with a logarithmic image sensor dedicated to minimize the quantization noise of the high dynamic applications is presented. The proposed implementation exploits a non-linear voltage-controlled-oscillator (VCO) based analog-to-digital converter (ADC) to perform the gamma correction during the analog-to-digital conversion. As a result, the quantization noise does not increase while the same high dynamic range of logarithmic image sensor is preserved. Moreover, by combining the gamma correction with the analog-to-digital conversion, the silicon area and overall power consumption can be greatly reduced. The proposed gamma correction scheme is validated by the reported simulation results and the experimental results measured for our designed test structure, which is fabricated with 0.35 μm standard complementary-metal-oxide-semiconductor (CMOS) process. PMID:25517692

  14. A novel loss compensation technique analysis and design for 60 GHz CMOS SPDT switch

    NASA Astrophysics Data System (ADS)

    Zonghua, Zheng; Lingling, Sun; Jun, Liu; Shengzhou, Zhang

    2016-01-01

    A novel loss compensation technique for a series-shunt single-pole double-throw (SPDT) switch is presented operating in the 60 GHz. The feed-forward compensation network which is composed of an NMOS, a couple capacitance and a shunt inductance can reduce the impact of the feed forward capacitance to reduce the insertion loss and improve the isolation of the SPDT switch. The measured insertion loss and isolation characteristics of the switch somewhat deviating from the 60 GHz are analyzed revealing that the inaccuracy of the MOS model can greatly degrade the performance of the switch. The switch is implemented in TSMC 90-nm CMOS process and exhibits an isolation of above 27 dB at transmitter mode, and the insertion loss of 1.8-3 dB at 30-65 GHz by layout simulation. The measured insertion loss is 2.45 dB at 52 GHz and keeps < 4 dB at 30-64 GHz. The measured isolation is better than 25 dB at 30-64 GHz and the measured return loss is better than 10 dB at 30-65 GHz. A measured input 1 dB gain compression point of the switch is 13 dBm at 52 GHz and 15 dBm at 60 GHz. The simulated switching speed with rise time and fall time are 720 and 520 ps, respectively. The active chip size of the proposed switch is 0.5 × 0.95 mm2. Project supported by the National Natural Science Foundation of China (Nos. 61331006, 61372021).

  15. Graphene/Si CMOS Hybrid Hall Integrated Circuits

    PubMed Central

    Huang, Le; Xu, Huilong; Zhang, Zhiyong; Chen, Chengying; Jiang, Jianhua; Ma, Xiaomeng; Chen, Bingyan; Li, Zishen; Zhong, Hua; Peng, Lian-Mao

    2014-01-01

    Graphene/silicon CMOS hybrid integrated circuits (ICs) should provide powerful functions which combines the ultra-high carrier mobility of graphene and the sophisticated functions of silicon CMOS ICs. But it is difficult to integrate these two kinds of heterogeneous devices on a single chip. In this work a low temperature process is developed for integrating graphene devices onto silicon CMOS ICs for the first time, and a high performance graphene/CMOS hybrid Hall IC is demonstrated. Signal amplifying/process ICs are manufactured via commercial 0.18 um silicon CMOS technology, and graphene Hall elements (GHEs) are fabricated on top of the passivation layer of the CMOS chip via a low-temperature micro-fabrication process. The sensitivity of the GHE on CMOS chip is further improved by integrating the GHE with the CMOS amplifier on the Si chip. This work not only paves the way to fabricate graphene/Si CMOS Hall ICs with much higher performance than that of conventional Hall ICs, but also provides a general method for scalable integration of graphene devices with silicon CMOS ICs via a low-temperature process. PMID:24998222

  16. High dynamic range CMOS image sensor with pixel level ADC and in-situ image enhancement

    NASA Astrophysics Data System (ADS)

    Harton, Austin V.; Ahmed, Mohamed I.; Beuhler, Allyson; Castro, Francisco; Dawson, Linda M.; Herold, Barry W.; Kujawa, Gregory; Lee, King F.; Mareachen, Russell D.; Scaminaci, Tony J.

    2005-03-01

    We describe a CMOS image sensor with pixel level analog to digital conversion (ADC) having high dynamic range (>100db) and the capability of performing many image processing functions at the pixel level during image capture. The sensor has a 102x98 pixel array and is implemented in a 0.18um CMOS process technology. Each pixel is 15.5um x15.5um with 15% fill factor and is comprised of a comparator, two 10 bit memory registers and control logic. A digital to analog converter and system processor are located off-chip. The photodetector produces a photocurrent yielding a photo-voltage proportional to the impinging light intensity. Once the photo-voltage is less than a predetermined global reference voltage; a global code value is latched into the pixel data buffer. This process prevents voltage saturation resulting in high dynamic range imaging. Upon completion of image capture, a digital representation of the image exists at the pixel array, thereby, allowing image data to be accessed in a parallel fashion from the focal plane array. It is demonstrated that by appropriate variation of the global reference voltage with time, it is possible to perform, during image capture, thresholding and image enhancement operations, such as, contrast stretching in a parallel manner.

  17. Ultralow-Loss CMOS Copper Plasmonic Waveguides.

    PubMed

    Fedyanin, Dmitry Yu; Yakubovsky, Dmitry I; Kirtaev, Roman V; Volkov, Valentyn S

    2016-01-13

    Surface plasmon polaritons can give a unique opportunity to manipulate light at a scale well below the diffraction limit reducing the size of optical components down to that of nanoelectronic circuits. At the same time, plasmonics is mostly based on noble metals, which are not compatible with microelectronics manufacturing technologies. This prevents plasmonic components from integration with both silicon photonics and silicon microelectronics. Here, we demonstrate ultralow-loss copper plasmonic waveguides fabricated in a simple complementary metal-oxide semiconductor (CMOS) compatible process, which can outperform gold plasmonic waveguides simultaneously providing long (>40 μm) propagation length and deep subwavelength (∼λ(2)/50, where λ is the free-space wavelength) mode confinement in the telecommunication spectral range. These results create the backbone for the development of a CMOS plasmonic platform and its integration in future electronic chips. PMID:26654281

  18. Spectrum acquisition of detonation based on CMOS

    NASA Astrophysics Data System (ADS)

    Li, Yan; Bai, Yonglin; Wang, Bo; Liu, Baiyu; Xue, Yingdong; Zhang, Wei; Gou, Yongsheng; Bai, Xiaohong; Qin, Junjun; Xian, Ouyang

    2010-10-01

    The detection of high-speed dynamic spectrum is the main method to acquire transient information. In order to obtain the large amount spectral data in real-time during the process of detonation, a CMOS-based system with high-speed spectrum data acquisition is designed. The hardware platform of the system is based on FPGA, and the unique characteristic of CMOS image sensors in the rolling shutter model is used simultaneously. Using FPGA as the master control chip of the system, not only provides the time sequence for CIS, but also controls the storage and transmission of the spectral data. In the experiment of spectral data acquisition, the acquired information is transmitted to the host computer through the CameraLink bus. The dynamic spectral curve is obtained after the subsequent processing. The experimental results demonstrate that this system is feasible in the acquisition and storage of high-speed dynamic spectrum information during the process of detonation.

  19. IR CMOS: infrared enhanced silicon imaging

    NASA Astrophysics Data System (ADS)

    Pralle, M. U.; Carey, J. E.; Haddad, Homayoon; Vineis, C.; Sickler, J.; Li, X.; Jiang, J.; Sahebi, F.; Palsule, C.; McKee, J.

    2013-06-01

    SiOnyx has developed visible and infrared CMOS image sensors leveraging a proprietary ultrafast laser semiconductor process technology. This technology demonstrates 10 fold improvements in infrared sensitivity over incumbent imaging technology while maintaining complete compatibility with standard CMOS image sensor process flows. Furthermore, these sensitivity enhancements are achieved on a focal plane with state of the art noise performance of 2 electrons/pixel. By capturing light in the visible regime as well as infrared light from the night glow, this sensor technology provides imaging in daytime through twilight and into nighttime conditions. The measured 10x quantum efficiency at the critical 1064 nm laser node enables see spot imaging capabilities in a variety of ambient conditions. The spectral sensitivity is from 400 to 1200 nm.

  20. Cmos spdt switch for wlan applications

    NASA Astrophysics Data System (ADS)

    Bhuiyan, M. A. S.; Reaz, M. B. I.; Rahman, L. F.; Minhad, K. N.

    2015-04-01

    WLAN has become an essential part of our today's life. The advancement of CMOS technology let the researchers contribute low power, size and cost effective WLAN devices. This paper proposes a single pole double through transmit/receive (T/R) switch for WLAN applications in 0.13 μm CMOS technology. The proposed switch exhibit 1.36 dB insertion loss, 25.3 dB isolation and 24.3 dBm power handling capacity. Moreover, it only dissipates 786.7 nW power per cycle. The switch utilizes only transistor aspect ratio optimization and resistive body floating technique to achieve such desired performance. In this design the use of bulky inductor and capacitor is avoided to evade imposition of unwanted nonlinearities to the communication signal.

  1. A 10-bit ratio-independent cyclic ADC with offset canceling for a CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Kaiming, Nie; Suying, Yao; Jiangtao, Xu; Zhaorui, Jiang

    2014-03-01

    A 10-bit ratio-independent switch-capacitor (SC) cyclic analog-to-digital converter (ADC) with offset canceling for a CMOS image sensor is presented. The proposed ADC completes an N-bit conversion in 1.5N clock cycles with one operational amplifier. Combining ratio-independent and polarity swapping techniques, the conversion characteristic of the proposed cyclic ADC is inherently insensitive both to capacitor ratio and to amplifier offset voltage. Therefore, the circuit can be realized in a small die area and it is suitable to serve as the column-parallel ADC in CMOS image sensors. A prototype ADC is fabricated in 0.18-μm one-poly four-metal CMOS technology. The measured results indicate that the ADC has a signal-to-noise and distortion ratio (SNDR) of 53.6 dB and a DNL of +0:12/-0:14 LSB at a conversion rate of 600 kS/s. The standard deviation of the offset variation of the ADC is reduced from 2.5 LSB to 0.5 LSB. Its power dissipation is 250 μW with a 1.8 V supply, and its area is 0.03 × 0.8 mm2.

  2. CMOS-Technology-Enabled Flexible and Stretchable Electronics for Internet of Everything Applications.

    PubMed

    Hussain, Aftab M; Hussain, Muhammad M

    2016-06-01

    Flexible and stretchable electronics can dramatically enhance the application of electronics for the emerging Internet of Everything applications where people, processes, data and devices will be integrated and connected, to augment quality of life. Using naturally flexible and stretchable polymeric substrates in combination with emerging organic and molecular materials, nanowires, nanoribbons, nanotubes, and 2D atomic crystal structured materials, significant progress has been made in the general area of such electronics. However, high volume manufacturing, reliability and performance per cost remain elusive goals for wide commercialization of these electronics. On the other hand, highly sophisticated but extremely reliable, batch-fabrication-capable and mature complementary metal oxide semiconductor (CMOS)-based technology has facilitated tremendous growth of today's digital world using thin-film-based electronics; in particular, bulk monocrystalline silicon (100) which is used in most of the electronics existing today. However, one fundamental challenge is that state-of-the-art CMOS electronics are physically rigid and brittle. Therefore, in this work, how CMOS-technology-enabled flexible and stretchable electronics can be developed is discussed, with particular focus on bulk monocrystalline silicon (100). A comprehensive information base to realistically devise an integration strategy by rational design of materials, devices and processes for Internet of Everything electronics is offered. PMID:26607553

  3. CMOS focal-plane-array for analysis of enzymatic reaction in system-on-chip spectrophotometer

    NASA Astrophysics Data System (ADS)

    Wang, Dong; Ha, Chanki; Park, Chan B.; Joo, Youngjoong

    2004-06-01

    A CMOS focal-plane-array is designed for the high-throughput analysis of enzymatic reaction in on-chip spectrophotometer system. One of potential applications of the presented prototype system is to perform enzymatic analysis of biocompounds contained in blood. This function normally requires an expensive diode-array spectrophotometer, but it is possible to perform high throughput analysis with low budget if the spectrophotometer system is scaled down to a chip. The CMOS active pixel sensor array can cover a layer of polydimethylsiloxane (PDMS) forming the microfluidic channels and the substrate solution for enzymatic reaction can be injected into the channels by capillary force. Under room light, the underneath CMOS active pixel sensor with 40 x 40 pixels detect the gray levels of the fluid"s color. Inside the image sensor chip (size: 3mm x 3mm), the pixels of the same column share the same sample and hold circuits. The analog signals from 40 columns are multiplexed into one input feeding an on-chip 8 bits dual-slope analog to digital converter. The color change can be displayed on the external monitor by using a data acquisition card and personal computer.

  4. Gun muzzle flash detection using a CMOS single photon avalanche diode

    NASA Astrophysics Data System (ADS)

    Merhav, Tomer; Savuskan, Vitali; Nemirovsky, Yael

    2013-10-01

    Si based sensors, in particular CMOS Image sensors, have revolutionized low cost imaging systems but to date have hardly been considered as possible candidates for gun muzzle flash detection, due to performance limitations, and low SNR in the visible spectrum. In this study, a CMOS Single Photon Avalanche Diode (SPAD) module is used to record and sample muzzle flash events in the visible spectrum, from representative weapons, common on the modern battlefield. SPADs possess two crucial properties for muzzle flash imaging - Namely, very high photon detection sensitivity, coupled with a unique ability to convert the optical signal to a digital signal at the source pixel, thus practically eliminating readout noise. This enables high sampling frequencies in the kilohertz range without SNR degradation, in contrast to regular CMOS image sensors. To date, the SPAD has not been utilized for flash detection in an uncontrolled environment, such as gun muzzle flash detection. Gun propellant manufacturers use alkali salts to suppress secondary flashes ignited during the muzzle flash event. Common alkali salts are compounds based on Potassium or Sodium, with spectral emission lines around 769nm and 589nm, respectively. A narrow band filter around the Potassium emission doublet is used in this study to favor the muzzle flash signal over solar radiation. This research will demonstrate the SPAD's ability to accurately sample and reconstruct the temporal behavior of the muzzle flash in the visible wavelength under the specified imaging conditions. The reconstructed signal is clearly distinguishable from background clutter, through exploitation of flash temporal characteristics.

  5. CMOS Camera Array With Onboard Memory

    NASA Technical Reports Server (NTRS)

    Gat, Nahum

    2009-01-01

    A compact CMOS (complementary metal oxide semiconductor) camera system has been developed with high resolution (1.3 Megapixels), a USB (universal serial bus) 2.0 interface, and an onboard memory. Exposure times, and other operating parameters, are sent from a control PC via the USB port. Data from the camera can be received via the USB port and the interface allows for simple control and data capture through a laptop computer.

  6. CMOS-array design-automation techniques

    NASA Technical Reports Server (NTRS)

    Feller, A.; Lombardt, T.

    1979-01-01

    Thirty four page report discusses design of 4,096-bit complementary metal oxide semiconductor (CMOS) read-only memory (ROM). CMOSROM is either mask or laser programable. Report is divided into six sections; section one describes background of ROM chips; section two presents design goals for chip; section three discusses chip implementation and chip statistics; conclusions and recommendations are given in sections four thru six.

  7. Advanced CMOS Radiation Effects Testing Analysis

    NASA Technical Reports Server (NTRS)

    Pellish, Jonathan Allen; Marshall, Paul W.; Rodbell, Kenneth P.; Gordon, Michael S.; LaBel, Kenneth A.; Schwank, James R.; Dodds, Nathaniel A.; Castaneda, Carlos M.; Berg, Melanie D.; Kim, Hak S.; Phan, Anthony M.; Seidleck, Christina M.

    2014-01-01

    Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop (ETW). The material includes an update of progress in this NEPP task area over the past year, which includes testing, evaluation, and analysis of radiation effects data on the IBM 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) process. The testing was conducted using test vehicles supplied by directly by IBM.

  8. Advanced CMOS Radiation Effects Testing and Analysis

    NASA Technical Reports Server (NTRS)

    Pellish, J. A.; Marshall, P. W.; Rodbell, K. P.; Gordon, M. S.; LaBel, K. A.; Schwank, J. R.; Dodds, N. A.; Castaneda, C. M.; Berg, M. D.; Kim, H. S.; Phan, A. M.; Seidleck, C. M.

    2014-01-01

    Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop (ETW). The material includes an update of progress in this NEPP task area over the past year, which includes testing, evaluation, and analysis of radiation effects data on the IBM 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) process. The testing was conducted using test vehicles supplied by directly by IBM.

  9. Radiation effects on scientific CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Yuanfu, Zhao; Liyan, Liu; Xiaohui, Liu; Xiaofeng, Jin; Xiang, Li

    2015-11-01

    A systemic solution for radiation hardened design is presented. Besides, a series of experiments have been carried out on the samples, and then the photoelectric response characteristic and spectral characteristic before and after the experiments have been comprehensively analyzed. The performance of the CMOS image sensor with the radiation hardened design technique realized total-dose resilience up to 300 krad(Si) and resilience to single-event latch up for LET up to 110 MeV·cm2/mg.

  10. Area- and energy-efficient CORDIC accelerators in deep sub-micron CMOS technologies

    NASA Astrophysics Data System (ADS)

    Vishnoi, U.; Noll, T. G.

    2012-09-01

    The COordinate Rotate DIgital Computer (CORDIC) algorithm is a well known versatile approach and is widely applied in today's SoCs for especially but not restricted to digital communications. Dedicated CORDIC blocks can be implemented in deep sub-micron CMOS technologies at very low area and energy costs and are attractive to be used as hardware accelerators for Application Specific Instruction Processors (ASIPs). Thereby, overcoming the well known energy vs. flexibility conflict. Optimizing Global Navigation Satellite System (GNSS) receivers to reduce the hardware complexity is an important research topic at present. In such receivers CORDIC accelerators can be used for digital baseband processing (fixed-point) and in Position-Velocity-Time estimation (floating-point). A micro architecture well suited to such applications is presented. This architecture is parameterized according to the wordlengths as well as the number of iterations and can be easily extended for floating point data format. Moreover, area can be traded for throughput by partially or even fully unrolling the iterations, whereby the degree of pipelining is organized with one CORDIC iteration per cycle. From the architectural description, the macro layout can be generated fully automatically using an in-house datapath generator tool. Since the adders and shifters play an important role in optimizing the CORDIC block, they must be carefully optimized for high area and energy efficiency in the underlying technology. So, for this purpose carry-select adders and logarithmic shifters have been chosen. Device dimensioning was automatically optimized with respect to dynamic and static power, area and performance using the in-house tool. The fully sequential CORDIC block for fixed-point digital baseband processing features a wordlength of 16 bits, requires 5232 transistors, which is implemented in a 40-nm CMOS technology and occupies a silicon area of 1560 μm2 only. Maximum clock frequency from circuit

  11. Design and implementation of IEEE 802.11ac MAC controller in 65 nm CMOS process

    NASA Astrophysics Data System (ADS)

    Peng, Cheng; Bin, Wu; Yong, Hei

    2016-02-01

    An IEEE-802.11ac-1*1 wireless LAN system-on-a-chip (SoC) that integrates an analog front end, a digital base-band processor and a media access controller has been implemented in 65 nm CMOS technology. It can provide significantly increased throughput, high efficiency rate selection, and fully backward compatibility with the existing 802.11a/n WLAN protocols. Especially the measured maximum throughput of UDP traffic can be up to 267 Mbps. Project supported by the National Great Specific Project of China (No. 2012ZX03004004_001).

  12. Development of CMOS Active Pixel Image Sensors for Low Cost Commercial Applications

    NASA Technical Reports Server (NTRS)

    Fossum, E.; Gee, R.; Kemeny, S.; Kim, Q.; Mendis, S.; Nakamura, J.; Nixon, R.; Ortiz, M.; Pain, B.; Zhou, Z.; Ackland, B.; Dickinson, A.; Eid, E.; Inglis, D.

    1994-01-01

    This paper describes ongoing research and development of CMOS active pixel image sensors for low cost commercial applications. A number of sensor designs have been fabricated and tested in both p-well and n-well technologies. Major elements in the development of the sensor include on-chip analog signal processing circuits for the reduction of fixed pattern noise, on-chip timing and control circuits and on-chip analog-to-digital conversion (ADC). Recent results and continuing efforts in these areas will be presented.

  13. Radiation characteristics of scintillator coupled CMOS APS for radiography conditions

    NASA Astrophysics Data System (ADS)

    Kim, Kwang Hyun; Kim, Soongpyung; Kang, Dong-Won; Kim, Dong-Kie

    2006-11-01

    Under industrial radiography conditions, we analyzed short-term radiation characteristics of scintillator coupled CMOS APS (hereinafter SC CMOS APS). By means of experimentation, the contribution of the transmitted X-ray through the scintillator to the properties of the CMOS APS and the afterimage, generated in the acquired image even at low dose condition, were investigated. To see the transmitted X-ray effects on the CMOS APS, Fein focus™ X-ray machine, two scintillators of Lanex™ Fine and Regular, and two CMOS APS array of RadEye™ were used under the conditions of 50 kV p/1 mAs and 100 kV p/1 mAs. By measuring the transmitted X-ray on signal and Noise Power Spectrum, we analytically examined the generation mechanism of the afterimage, based on dark signal or dark current increase in the sensor, and explained the afterimage in the SC CMOS APS.

  14. Efficient design of CMOS TSC checkers

    NASA Technical Reports Server (NTRS)

    Biddappa, Anita; Shamanna, Manjunath K.; Maki, Gary; Whitaker, Sterling

    1990-01-01

    This paper considers the design of an efficient, robustly testable, CMOS Totally Self-Checking (TSC) Checker for k-out-of-2k codes. Most existing implementations use primitive gates and assume the single stuck-at fault model. The self-testing property has been found to fail for CMOS TSC checkers under the stuck-open fault model due to timing skews and arbitrary delays in the circuit. A new four level design using CMOS primitive gates (NAND, NOR, INVERTERS) is presented. This design retains its properties under the stuck-open fault model. Additionally, this method offers an impressive reduction (greater than 70 percent) in gate count, gate inputs, and test set size when compared to the existing method. This implementation is easily realizable and is based on Anderson's technique. A thorough comparative study has been made on the proposed implementation and Kundu's implementation and the results indicate that the proposed one is better than Kundu's in all respects for k-out-of-2k codes.

  15. Quantitative optical metrology with CMOS cameras

    NASA Astrophysics Data System (ADS)

    Furlong, Cosme; Kolenovic, Ervin; Ferguson, Curtis F.

    2004-08-01

    Recent advances in laser technology, optical sensing, and computer processing of data, have lead to the development of advanced quantitative optical metrology techniques for high accuracy measurements of absolute shapes and deformations of objects. These techniques provide noninvasive, remote, and full field of view information about the objects of interest. The information obtained relates to changes in shape and/or size of the objects, characterizes anomalies, and provides tools to enhance fabrication processes. Factors that influence selection and applicability of an optical technique include the required sensitivity, accuracy, and precision that are necessary for a particular application. In this paper, sensitivity, accuracy, and precision characteristics in quantitative optical metrology techniques, and specifically in optoelectronic holography (OEH) based on CMOS cameras, are discussed. Sensitivity, accuracy, and precision are investigated with the aid of National Institute of Standards and Technology (NIST) traceable gauges, demonstrating the applicability of CMOS cameras in quantitative optical metrology techniques. It is shown that the advanced nature of CMOS technology can be applied to challenging engineering applications, including the study of rapidly evolving phenomena occurring in MEMS and micromechatronics.

  16. Correct CMOS IC defect models for quality testing

    NASA Technical Reports Server (NTRS)

    Soden, Jerry M.; Hawkins, Charles F.

    1993-01-01

    Leading edge, high reliability, and low escape CMOS IC test practices have now virtually removed the stuck-at fault model and replaced it with more defect-orientated models. Quiescent power supply current testing (I(sub DDQ)) combined with strategic use of high speed test patterns is the recommended approach to zero defect and high reliability testing goals. This paper reviews the reasons for the change in CMOS IC test practices and outlines an improved CMOS IC test methodology.

  17. A Standard CMOS Humidity Sensor without Post-Processing

    PubMed Central

    Nizhnik, Oleg; Higuchi, Kohei; Maenaka, Kazusuke

    2011-01-01

    A 2 μW power dissipation, voltage-output, humidity sensor accurate to 5% relative humidity was developed using the LFoundry 0.15 μm CMOS technology without post-processing. The sensor consists of a woven lateral array of electrodes implemented in CMOS top metal, a Intervia Photodielectric 8023–10 humidity-sensitive layer, and a CMOS capacitance to voltage converter. PMID:22163949

  18. Behavior of faulty double BJT BiCMOS logic gates

    NASA Technical Reports Server (NTRS)

    Menon, Sankaran M.; Malaiya, Yashwant K.; Jayasumana, Anura P.

    1992-01-01

    Logic Behavior of a Double BJT BiCMOS device under transistor level shorts and opens is examined. In addition to delay faults, faults that cause the gate to exhibit sequential behavior were observed. Several faults can be detected only by monitoring the current. The faulty behavior of Bipolar (TTL) and CMOS logic families is compared with BiCMOS, to bring out the testability differences.

  19. Interferometric comparison of the performance of a CMOS and sCMOS detector

    NASA Astrophysics Data System (ADS)

    Flores-Moreno, J. M.; De la Torre I., Manuel H.; Hernández-Montes, M. S.; Pérez-López, Carlos; Mendoza S., Fernando

    2015-08-01

    We present an analysis of the imaging performance of two state-of-the-art sensors widely used in the nondestructive- testing area (NDT). The analysis is based on the quantification of the signal-to-noise (SNR) ratio from an optical phase image. The calculation of the SNR is based on the relation of the median (average) and standard deviation measurements over specific areas of interest in the phase images of both sensors. This retrieved phase is coming from the vibrational behavior of a large object by means of an out-of-plane holographic interferometer. The SNR is used as a figure-of-merit to evaluate and compare the performance of the CMOS and scientific CMOS (sCMOS) camera as part of the experimental set-up. One of the cameras has a high speed CMOS sensor while the other has a high resolution sCMOS sensor. The object under study is a metallically framed table with a Formica cover with an observable area of 1.1 m2. The vibration induced to the sample is performed by a linear step motor with an attached tip in the motion stage. Each camera is used once at the time to record the deformation keeping the same experimental conditions for each case. These measurements may complement the conventional procedures or technical information commonly used to evaluate a camerás performance such as: quantum efficiency, spatial resolution and others. Results present post processed images from both cameras, but showing a smoother and easy to unwrap optical phase coming from those recorded with the sCMOS camera.

  20. Envelope tracking CMOS power amplifier with high-speed CMOS envelope amplifier for mobile handsets

    NASA Astrophysics Data System (ADS)

    Yoshida, Eiji; Sakai, Yasufumi; Oishi, Kazuaki; Yamazaki, Hiroshi; Mori, Toshihiko; Yamaura, Shinji; Suto, Kazuo; Tanaka, Tetsu

    2014-01-01

    A high-efficiency CMOS power amplifier (PA) based on envelope tracking (ET) has been reported for a wideband code division multiple access (W-CDMA) and long term evolution (LTE) application. By adopting a high-speed CMOS envelope amplifier with current direction sensing, a 5% improvement in total power-added efficiency (PAE) and a 11 dB decrease in adjacent channel leakage ratio (ACLR) are achieved with a W-CDMA signal. Moreover, the proposed PA achieves a PAE of 25.4% for a 10 MHz LTE signal at an output power (Pout) of 25.6 dBm and a gain of 24 dB.

  1. Thermal Radiometer Signal Processing Using Radiation Hard CMOS Application Specific Integrated Circuits for Use in Harsh Planetary Environments

    NASA Technical Reports Server (NTRS)

    Quilligan, G.; DuMonthier, J.; Aslam, S.; Lakew, B.; Kleyner, I.; Katz, R.

    2015-01-01

    Thermal radiometers such as proposed for the Europa Clipper flyby mission require low noise signal processing for thermal imaging with immunity to Total Ionizing Dose (TID) and Single Event Latchup (SEL). Described is a second generation Multi- Channel Digitizer (MCD2G) Application Specific Integrated Circuit (ASIC) that accurately digitizes up to 40 thermopile pixels with greater than 50 Mrad (Si) immunity TID and 174 MeV-sq cm/mg SEL. The MCD2G ASIC uses Radiation Hardened By Design (RHBD) techniques with a 180 nm CMOS process node.

  2. Thermal Radiometer Signal Processing using Radiation Hard CMOS Application Specific Integrated Circuits for use in Harsh Planetary Environments

    NASA Astrophysics Data System (ADS)

    Quilligan, G.; DuMonthier, J.; Aslam, S.; Lakew, B.; Kleyner, I.; Katz, R.

    2015-10-01

    Thermal radiometers such as proposed for the Europa Clipper flyby mission [1] require low noise signal processing for thermal imaging with immunity to Total Ionizing Dose (TID) and Single Event Latchup (SEL). Described is a second generation Multi- Channel Digitizer (MCD2G) Application Specific Integrated Circuit (ASIC) that accurately digitizes up to 40 thermopile pixels with greater than 50 Mrad (Si) immunity TID and 174 MeV-cm2/mg SEL. The MCD2G ASIC uses Radiation Hardened By Design (RHBD) techniques with a 180 nm CMOS process node.

  3. Development of a large-area CMOS-based detector for real-time x-ray imaging

    NASA Astrophysics Data System (ADS)

    Heo, Sung Kyn; Park, Sung Kyu; Hwang, Sung Ha; Im, Dong Ak; Kosonen, Jari; Kim, Tae Woo; Yun, Seungman; Kim, Ho Kyung

    2010-04-01

    Complementary metal-oxide-semiconductor (CMOS) active pixel sensors (APSs) with high electrical and optical performances are now being attractive for digital radiography (DR) and dental cone-beam computed tomography (CBCT). In this study, we report our prototype CMOS-based detectors capable of real-time imaging. The field-of-view of the detector is 12 × 14.4 cm. The detector employs a CsI:Tl scintillator as an x-ray-to-light converter. The electrical performance of the CMOS APS, such as readout noise and full-well capacity, was evaluated. The x-ray imaging characteristics of the detector were evaluated in terms of characteristic curve, pre-sampling modulation transfer function, noise power spectrum, detective quantum efficiency, and image lag. The overall performance of the detector is demonstrated with phantom images obtained for DR and CBCT applications. The detailed development description and measurement results are addressed. With the results, we suggest that the prototype CMOS-based detector has the potential for CBCT and real-time x-ray imaging applications.

  4. A CMOS Pressure Sensor Tag Chip for Passive Wireless Applications

    PubMed Central

    Deng, Fangming; He, Yigang; Li, Bing; Zuo, Lei; Wu, Xiang; Fu, Zhihui

    2015-01-01

    This paper presents a novel monolithic pressure sensor tag for passive wireless applications. The proposed pressure sensor tag is based on an ultra-high frequency RFID system. The pressure sensor element is implemented in the 0.18 µm CMOS process and the membrane gap is formed by sacrificial layer release, resulting in a sensitivity of 1.2 fF/kPa within the range from 0 to 600 kPa. A three-stage rectifier adopts a chain of auxiliary floating rectifier cells to boost the gate voltage of the switching transistors, resulting in a power conversion efficiency of 53% at the low input power of −20 dBm. The capacitive sensor interface, using phase-locked loop archietcture, employs fully-digital blocks, which results in a 7.4 bits resolution and 0.8 µW power dissipation at 0.8 V supply voltage. The proposed passive wireless pressure sensor tag costs a total 3.2 µW power dissipation. PMID:25806868

  5. A CMOS pressure sensor tag chip for passive wireless applications.

    PubMed

    Deng, Fangming; He, Yigang; Li, Bing; Zuo, Lei; Wu, Xiang; Fu, Zhihui

    2015-01-01

    This paper presents a novel monolithic pressure sensor tag for passive wireless applications. The proposed pressure sensor tag is based on an ultra-high frequency RFID system. The pressure sensor element is implemented in the 0.18 µm CMOS process and the membrane gap is formed by sacrificial layer release, resulting in a sensitivity of 1.2 fF/kPa within the range from 0 to 600 kPa. A three-stage rectifier adopts a chain of auxiliary floating rectifier cells to boost the gate voltage of the switching transistors, resulting in a power conversion efficiency of 53% at the low input power of -20 dBm. The capacitive sensor interface, using phase-locked loop archietcture, employs fully-digital blocks, which results in a 7.4 bits resolution and 0.8 µW power dissipation at 0.8 V supply voltage. The proposed passive wireless pressure sensor tag costs a total 3.2 µW power dissipation. PMID:25806868

  6. A hierarchical approach to test generation for CMOS VLSI circuits

    NASA Astrophysics Data System (ADS)

    Weening, Edward Christiaan

    A hierarchical approach to the automatic test pattern generation for large digital VLSI circuits, fabricated in CMOS technology, is developed and implemented. The use of information on the circuit's hierarchy, which is readily available from most modern CAD (Computer Aided Design) systems, speeds up the test generation process considerably and enhances the quality of the tests generated. The hierarchical test generation tool can also be integrated in future CAD systems making test generation and testability enhancement during circuit design feasible. The hierarchical approach is described at the switch, functional, and behavioral level. A test pattern generation algorithm at the switch level is presented. Test generation and fault simulation algorithms both using OBDD (Ordered Binary Decision Diagram) functional descriptions of the circuit modules are presented. A test plan generation method at the behavioral level is presented. Practical results show that the hierarchical approach to test generation is more efficient than a conventional, non-hierarchical approach, especially for switch level faults. The results also show that the use of Design For Testability (DFT) circuitry is supported at the behavioral level.

  7. Multi-Aperture CMOS Sun Sensor for Microsatellite Attitude Determination.

    PubMed

    Rufino, Giancarlo; Grassi, Michele

    2009-01-01

    This paper describes the high precision digital sun sensor under development at the University of Naples. The sensor determines the sun line orientation in the sensor frame from the measurement of the sun position on the focal plane. It exploits CMOS technology and an original optical head design with multiple apertures. This allows simultaneous multiple acquisitions of the sun as spots on the focal plane. The sensor can be operated either with a fixed or a variable number of sun spots, depending on the required field of view and sun-line measurement precision. Multiple acquisitions are averaged by using techniques which minimize the computational load to extract the sun line orientation with high precision. Accuracy and computational efficiency are also improved thanks to an original design of the calibration function relying on neural networks. Extensive test campaigns are carried out using a laboratory test facility reproducing sun spectrum, apparent size and distance, and variable illumination directions. Test results validate the sensor concept, confirming the precision improvement achievable with multiple apertures, and sensor operation with a variable number of sun spots. Specifically, the sensor provides accuracy and precision in the order of 1 arcmin and 1 arcsec, respectively. PMID:22408538

  8. Multi-Aperture CMOS Sun Sensor for Microsatellite Attitude Determination

    PubMed Central

    Rufino, Giancarlo; Grassi, Michele

    2009-01-01

    This paper describes the high precision digital sun sensor under development at the University of Naples. The sensor determines the sun line orientation in the sensor frame from the measurement of the sun position on the focal plane. It exploits CMOS technology and an original optical head design with multiple apertures. This allows simultaneous multiple acquisitions of the sun as spots on the focal plane. The sensor can be operated either with a fixed or a variable number of sun spots, depending on the required field of view and sun-line measurement precision. Multiple acquisitions are averaged by using techniques which minimize the computational load to extract the sun line orientation with high precision. Accuracy and computational efficiency are also improved thanks to an original design of the calibration function relying on neural networks. Extensive test campaigns are carried out using a laboratory test facility reproducing sun spectrum, apparent size and distance, and variable illumination directions. Test results validate the sensor concept, confirming the precision improvement achievable with multiple apertures, and sensor operation with a variable number of sun spots. Specifically, the sensor provides accuracy and precision in the order of 1 arcmin and 1 arcsec, respectively. PMID:22408538

  9. RF Variable-Gain Amplifiers and AGC Loops for Digital TV Receivers

    NASA Astrophysics Data System (ADS)

    Iizuka, Kunihiko; Koutani, Masato; Mitsunaka, Takeshi; Kawamura, Hiroshi; Toyoyama, Shinji; Miyamoto, Masayuki; Matsuzawa, Akira

    RF Variable Gain Amplifiers (RF-VGA) are important components for integrated TV broadcast receivers. Analog and digital controlled RF-VGAs are compared in terms of linearity and an AGC loop architecture suitable for digitally controlled RF-VGA is proposed. Further linearity enhancement applicable for CMOS implementation is also discussed.

  10. Characterization and comparison of lateral amorphous semiconductors with embedded Frisch grid detectors on 0.18μm CMOS processed substrate for medical imaging applications

    NASA Astrophysics Data System (ADS)

    Hristovski, Christos; Goldan, Amir; Majid, Shaikh Hasibul; Wang, Kai; Shafique, Umar; Karim, Karim

    2011-03-01

    An indirect digital x-ray detector is designed, fabricated, and tested. The detector integrates a high speed, low noise CMOS substrate with two types of amorphous semiconductors on the circuit surface. Using a laterally oriented layout a-Si:H or a-Se can be used to coat the CMOS circuit and provide high speed photoresponse to complement the high speed circuits possible on CMOS technology. The circuit also aims to reduce the effect of slow carriers by integrated a Frisch style grid on the photoconductive layer to screen for the slow carriers. Simulations show a uniform photoresponse for photons absorbed on the top layer and an enhanced response when using a Frisch grid. EQE and noise results are presented. Finally, possible applications and improvements to the area of indirect x-ray imaging that are capable of easily being implemented on the substrate are suggested.

  11. Lab-on-CMOS Integration of Microfluidics and Electrochemical Sensors

    PubMed Central

    Huang, Yue; Mason, Andrew J.

    2013-01-01

    This paper introduces a CMOS-microfluidics integration scheme for electrochemical microsystems. A CMOS chip was embedded into a micro-machined silicon carrier. By leveling the CMOS chip and carrier surface to within 100 nm, an expanded obstacle-free surface suitable for photolithography was achieved. Thin film metal planar interconnects were microfabricated to bridge CMOS pads to the perimeter of the carrier, leaving a flat and smooth surface for integrating microfluidic structures. A model device containing SU-8 microfluidic mixers and detection channels crossing over microelectrodes on a CMOS integrated circuit was constructed using the chip-carrier assembly scheme. Functional integrity of microfluidic structures and on-CMOS electrodes was verified by a simultaneous sample dilution and electrochemical detection experiment within multi-channel microfluidics. This lab-on-CMOS integration process is capable of high packing density, is suitable for wafer-level batch production, and opens new opportunities to combine the performance benefits of on-CMOS sensors with lab-on-chip platforms. PMID:23939616

  12. CMOS-compatible RF MEMS switch

    NASA Astrophysics Data System (ADS)

    Lakamraju, Narendra V.; Kim, Bruce; Phillips, Stephen M.

    2004-08-01

    Mobile technologies have relied on RF switches for a long time. Though the basic function of the switch has remained the same, the way they have been made has changed in the recent past. In the past few years work has been done to use MEMS technologies in designing and fabricating an RF switch that would in many ways replace the electronic and mechanical switches that have been used for so long. The work that is described here is an attempt to design and fabricate an RF MEMS switch that can handle higher RF power and have CMOS compatible operating voltages.

  13. Vertical Isolation for Photodiodes in CMOS Imagers

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata

    2008-01-01

    In a proposed improvement in complementary metal oxide/semi conduct - or (CMOS) image detectors, two additional implants in each pixel would effect vertical isolation between the metal oxide/semiconductor field-effect transistors (MOSFETs) and the photodiode of the pixel. This improvement is expected to enable separate optimization of the designs of the photodiode and the MOSFETs so as to optimize their performances independently of each other. The purpose to be served by enabling this separate optimization is to eliminate or vastly reduce diffusion cross-talk, thereby increasing sensitivity, effective spatial resolution, and color fidelity while reducing noise.

  14. Monolithic CMOS imaging x-ray spectrometers

    NASA Astrophysics Data System (ADS)

    Kenter, Almus; Kraft, Ralph; Gauron, Thomas; Murray, Stephen S.

    2014-07-01

    The Smithsonian Astrophysical Observatory (SAO) in collaboration with SRI/Sarnoff is developing monolithic CMOS detectors optimized for x-ray astronomy. The goal of this multi-year program is to produce CMOS x-ray imaging spectrometers that are Fano noise limited over the 0.1-10keV energy band while incorporating the many benefits of CMOS technology. These benefits include: low power consumption, radiation "hardness", high levels of integration, and very high read rates. Small format test devices from a previous wafer fabrication run (2011-2012) have recently been back-thinned and tested for response below 1keV. These devices perform as expected in regards to dark current, read noise, spectral response and Quantum Efficiency (QE). We demonstrate that running these devices at rates ~> 1Mpix/second eliminates the need for cooling as shot noise from any dark current is greatly mitigated. The test devices were fabricated on 15μm, high resistivity custom (~30kΩ-cm) epitaxial silicon and have a 16 by 192 pixel format. They incorporate 16μm pitch, 6 Transistor Pinned Photo Diode (6TPPD) pixels which have ~40μV/electron sensitivity and a highly parallel analog CDS signal chain. Newer, improved, lower noise detectors have just been fabricated (October 2013). These new detectors are fabricated on 9μm epitaxial silicon and have a 1k by 1k format. They incorporate similar 16μm pitch, 6TPPD pixels but have ~ 50% higher sensitivity and much (3×) lower read noise. These new detectors have undergone preliminary testing for functionality in Front Illuminated (FI) form and are presently being prepared for back thinning and packaging. Monolithic CMOS devices such as these, would be ideal candidate detectors for the focal planes of Solar, planetary and other space-borne x-ray astronomy missions. The high through-put, low noise and excellent low energy response, provide high dynamic range and good time resolution; bright, time varying x-ray features could be temporally and

  15. Advances in CMOS Solid-state Photomultipliers for Scintillation Detector Applications

    PubMed Central

    Christian, James F.; Stapels, Christopher J.; Johnson, Erik B.; McClish, Mickel; Dokhale, Purushotthom; Shah, Kanai S.; Mukhopadhyay, Sharmistha; Chapman, Eric; Augustine, Frank L.

    2014-01-01

    Solid-state photomultipliers (SSPMs) are a compact, lightweight, potentially low-cost alternative to a photomultiplier tube for a variety of scintillation detector applications, including digital-dosimeter and medical-imaging applications. Manufacturing SSPMs with a commercial CMOS process provides the ability for rapid prototyping, and facilitates production to reduce the cost. RMD designs CMOS SSPM devices that are fabricated by commercial foundries. This work describes the characterization and performance of these devices for scintillation detector applications. This work also describes the terms contributing to device noise in terms of the excess noise of the SSPM, the binomial statistics governing the number of pixels triggered by a scintillation event, and the background, or thermal, count rate. The fluctuations associated with these terms limit the resolution of the signal pulse amplitude. We explore the use of pixel-level signal conditioning, and characterize the performance of a prototype SSPM device that preserves the digital nature of the signal. In addition, we explore designs of position-sensitive SSPM detectors for medical imaging applications, and characterize their performance. PMID:25540471

  16. Optical modulation techniques for analog signal processing and CMOS compatible electro-optic modulation

    NASA Astrophysics Data System (ADS)

    Gill, Douglas M.; Rasras, Mahmoud; Tu, Kun-Yii; Chen, Young-Kai; White, Alice E.; Patel, Sanjay S.; Carothers, Daniel; Pomerene, Andrew; Kamocsai, Robert; Beattie, James; Kopa, Anthony; Apsel, Alyssa; Beals, Mark; Mitchel, Jurgen; Liu, Jifeng; Kimerling, Lionel C.

    2008-02-01

    Integrating electronic and photonic functions onto a single silicon-based chip using techniques compatible with mass-production CMOS electronics will enable new design paradigms for existing system architectures and open new opportunities for electro-optic applications with the potential to dramatically change the management, cost, footprint, weight, and power consumption of today's communication systems. While broadband analog system applications represent a smaller volume market than that for digital data transmission, there are significant deployments of analog electro-optic systems for commercial and military applications. Broadband linear modulation is a critical building block in optical analog signal processing and also could have significant applications in digital communication systems. Recently, broadband electro-optic modulators on a silicon platform have been demonstrated based on the plasma dispersion effect. The use of the plasma dispersion effect within a CMOS compatible waveguide creates new challenges and opportunities for analog signal processing since the index and propagation loss change within the waveguide during modulation. We will review the current status of silicon-based electrooptic modulators and also linearization techniques for optical modulation.

  17. A novel Bayer-like WRGB color filter array for CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Honda, Hiroto; Iida, Yoshinori; Itoh, Go; Egawa, Yoshitaka; Seki, Hiromichi

    2007-02-01

    We have developed a CMOS image sensor with a novel color filter array(CFA) where one of the green pixels of the Bayer pattern was replaced with a white pixel. A transparent layer has been fabricated on the white pixel instead of a color filter to realize over 95% transmission for visible light with wavelengths of 400-700 nm. Pixel pitch of the device was 3.3 um and the number of pixels was 2 million (1600H x 1200V). The novel Bayer-like WRGB (White-Red-Green-Blue) CFA realized higher signal-to-noise ratios of interpolated R, G, and B values in low illumination (3lux) by 6dB, 1dB, and 6dB, respectively, compared with those of the Bayer pattern, with the low-noise pre-digital signal process. Furthermore, there was no degradation of either resolution or color representation for the interpolated image. This new CFA has a great potential to significantly increase the sensitivity of CMOS/CCD image sensors with digital signal processing technology.

  18. A low-noise CMOS pixel direct charge sensor, Topmetal-II-

    NASA Astrophysics Data System (ADS)

    An, Mangmang; Chen, Chufeng; Gao, Chaosong; Han, Mikyung; Ji, Rong; Li, Xiaoting; Mei, Yuan; Sun, Quan; Sun, Xiangming; Wang, Kai; Xiao, Le; Yang, Ping; Zhou, Wei

    2016-02-01

    We report the design and characterization of a CMOS pixel direct charge sensor, Topmetal-II-, fabricated in a standard 0.35 μm CMOS Integrated Circuit process. The sensor utilizes exposed metal patches on top of each pixel to directly collect charge. Each pixel contains a low-noise charge-sensitive preamplifier to establish the analog signal and a discriminator with tunable threshold to generate hits. The analog signal from each pixel is accessible through time-shared multiplexing over the entire array. Hits are read out digitally through a column-based priority logic structure. Tests show that the sensor achieved a < 15e- analog noise and a 200e- minimum threshold for digital readout per pixel. The sensor is capable of detecting both electrons and ions drifting in gas. These characteristics enable its use as the charge readout device in future Time Projection Chambers without gaseous gain mechanism, which has unique advantages in low background and low rate-density experiments.

  19. The Digital Correction Unit: A data correction/compaction chip

    SciTech Connect

    MacKenzie, S.; Nielsen, B.; Paffrath, L.; Russell, J.; Sherden, D.

    1986-10-01

    The Digital Correction Unit (DCU) is a semi-custom CMOS integrated circuit which corrects and compacts data for the SLD experiment. It performs a piece-wise linear correction to data, and implements two separate compaction algorithms. This paper describes the basic functionality of the DCU and its correction and compaction algorithms.

  20. Theoretical performance analysis for CMOS based high resolution detectors.

    PubMed

    Jain, Amit; Bednarek, Daniel R; Rudin, Stephen

    2013-03-01

    High resolution imaging capabilities are essential for accurately guiding successful endovascular interventional procedures. Present x-ray imaging detectors are not always adequate due to their inherent limitations. The newly-developed high-resolution micro-angiographic fluoroscope (MAF-CCD) detector has demonstrated excellent clinical image quality; however, further improvement in performance and physical design may be possible using CMOS sensors. We have thus calculated the theoretical performance of two proposed CMOS detectors which may be used as a successor to the MAF. The proposed detectors have a 300 μm thick HL-type CsI phosphor, a 50 μm-pixel CMOS sensor with and without a variable gain light image intensifier (LII), and are designated MAF-CMOS-LII and MAF-CMOS, respectively. For the performance evaluation, linear cascade modeling was used. The detector imaging chains were divided into individual stages characterized by one of the basic processes (quantum gain, binomial selection, stochastic and deterministic blurring, additive noise). Ranges of readout noise and exposure were used to calculate the detectors' MTF and DQE. The MAF-CMOS showed slightly better MTF than the MAF-CMOS-LII, but the MAF-CMOS-LII showed far better DQE, especially for lower exposures. The proposed detectors can have improved MTF and DQE compared with the present high resolution MAF detector. The performance of the MAF-CMOS is excellent for the angiography exposure range; however it is limited at fluoroscopic levels due to additive instrumentation noise. The MAF-CMOS-LII, having the advantage of the variable LII gain, can overcome the noise limitation and hence may perform exceptionally for the full range of required exposures; however, it is more complex and hence more expensive. PMID:24353390

  1. 200-Mbps optical integrated circuit design and first iteration realizations in 1.2- and 0.8-micron Bi-CMOS technology

    NASA Astrophysics Data System (ADS)

    Snyman, Lukas W.; Chaing, C.-T.; Bogalecki, Alfons; Du Plessis, Monuko; Aharoni, Herzl

    2004-07-01

    A prototype Silicon CMOS Optical Integrated Circuit (Si CMOS OEIC) was designed and simulated using standard 0.8 micron Bi-CMOS silicon integrated circuit technology. The circuit consisted of an integrated silicon light emitting source, an optical wave-guiding structure, two integrated optical detectors and two high-gain CMOS transimpedance analogue amplifiers. Simulations with MicroSim PSpice software predict a utilizable bandwidth capability of up to 220 MHz for the trans-impedance amplifier for detected photo-currents at the input of the amplifier in the range of 1 nA to 100 nA and driving a 10mV to 1 V signal into a 100 kΩ load. First iteration OEIC structures were realised in 1.2 micron CMOS technology for various source-waveguide-detector arrangements. Current signal ranging from 1nA to 1 micro-amp was detected at detectors. The technology seems favorable for first-iteration implementation for digital communications on chip up to 200Mbps.

  2. Challenges of nickel silicidation in CMOS technologies

    SciTech Connect

    Breil, Nicolas; Lavoie, Christian; Ozcan, Ahmet; Baumann, Frieder; Klymko, Nancy; Nummy, Karen; Sun, Bing; Jordan-Sweet, Jean; Yu, Jian; Zhu, Frank; Narasimha, Shreesh; Chudzik, Michael

    2015-04-01

    In our paper, we review some of the key challenges associated with the Ni silicidation process in the most recent CMOS technologies. The introduction of new materials (e.g.SiGe), and of non-planar architectures bring some important changes that require fundamental investigation from a material engineering perspective. Following a discussion of the device architecture and silicide evolution through the last CMOS generations, we focus our study on a very peculiar defect, termed NiSi-Fangs. We describe a mechanism for the defect formation, and present a detailed material analysis that supports this mechanism. We highlight some of the possible metal enrichment processes of the nickel monosilicide such as oxidation or various RIE (Reactive Ion Etching) plasma process, leading to a metal source available for defect formation. Furthermore, we investigate the NiSi formation and re-formation silicidation differences between Si and SiGe materials, and between (1 0 0) and (1 1 1) orientations. Finally, we show that the thermal budgets post silicidation can lead to the formation of NiSi-Fangs if the structure and the processes are not optimized. Beyond the understanding of the defect and the discussion on the engineering solutions used to prevent its formation, the interest of this investigation also lies in the fundamental learning within the Ni–Pt–Si–Ge system and some additional perspective on Ni-based contacts to advanced microelectronic devices.

  3. Modulated CMOS camera for fluorescence lifetime microscopy.

    PubMed

    Chen, Hongtao; Holst, Gerhard; Gratton, Enrico

    2015-12-01

    Widefield frequency-domain fluorescence lifetime imaging microscopy (FD-FLIM) is a fast and accurate method to measure the fluorescence lifetime of entire images. However, the complexity and high costs involved in construction of such a system limit the extensive use of this technique. PCO AG recently released the first luminescence lifetime imaging camera based on a high frequency modulated CMOS image sensor, QMFLIM2. Here we tested and provide operational procedures to calibrate the camera and to improve the accuracy using corrections necessary for image analysis. With its flexible input/output options, we are able to use a modulated laser diode or a 20 MHz pulsed white supercontinuum laser as the light source. The output of the camera consists of a stack of modulated images that can be analyzed by the SimFCS software using the phasor approach. The nonuniform system response across the image sensor must be calibrated at the pixel level. This pixel calibration is crucial and needed for every camera settings, e.g. modulation frequency and exposure time. A significant dependency of the modulation signal on the intensity was also observed and hence an additional calibration is needed for each pixel depending on the pixel intensity level. These corrections are important not only for the fundamental frequency, but also for the higher harmonics when using the pulsed supercontinuum laser. With these post data acquisition corrections, the PCO CMOS-FLIM camera can be used for various biomedical applications requiring a large frame and high speed acquisition. PMID:26500051

  4. Evolutional Trend of Mixed Analog and Digital RF Circuits

    NASA Astrophysics Data System (ADS)

    Tanaka, Satoshi

    This paper describes recent technology trend of mixed analog digital RF circuits. With the progress of CMOS technology, large-scale digital signal process and control function can be integrated in an RF integrated circuit and some analog signal process blocks can be translated to digital signal processing units. At the same time, the design of remaining analog functional blocks becomes very hard. In this paper, those integration techniques for receiver and transmitter in these 20 years are reviewed. As a typical example of digital assisted systems, synthesizer based transmitters are discussed in detail.

  5. Noise-Induced Synchronization among Sub-RF CMOS Analog Oscillators for Skew-Free Clock Distribution

    NASA Astrophysics Data System (ADS)

    Utagawa, Akira; Asai, Tetsuya; Hirose, Tetsuya; Amemiya, Yoshihito

    We present on-chip oscillator arrays synchronized by random noises, aiming at skew-free clock distribution on synchronous digital systems. Nakao et al. recently reported that independent neural oscillators can be synchronized by applying temporal random impulses to the oscillators [1], [2]. We regard neural oscillators as independent clock sources on LSIs; i. e., clock sources are distributed on LSIs, and they are forced to synchronize through the use of random noises. We designed neuron-based clock generators operating at sub-RF region (<1GHz) by modifying the original neuron model to a new model that is suitable for CMOS implementation with 0.25-μm CMOS parameters. Through circuit simulations, we demonstrate that i) the clock generators are certainly synchronized by pseudo-random noises and ii) clock generators exhibited phase-locked oscillations even if they had small device mismatches.

  6. A Fast Multiple Sampling Method for Low-Noise CMOS Image Sensors With Column-Parallel 12-bit SAR ADCs

    PubMed Central

    Kim, Min-Kyu; Hong, Seong-Kwan; Kwon, Oh-Kyong

    2015-01-01

    This paper presents a fast multiple sampling method for low-noise CMOS image sensor (CIS) applications with column-parallel successive approximation register analog-to-digital converters (SAR ADCs). The 12-bit SAR ADC using the proposed multiple sampling method decreases the A/D conversion time by repeatedly converting a pixel output to 4-bit after the first 12-bit A/D conversion, reducing noise of the CIS by one over the square root of the number of samplings. The area of the 12-bit SAR ADC is reduced by using a 10-bit capacitor digital-to-analog converter (DAC) with four scaled reference voltages. In addition, a simple up/down counter-based digital processing logic is proposed to perform complex calculations for multiple sampling and digital correlated double sampling. To verify the proposed multiple sampling method, a 256 × 128 pixel array CIS with 12-bit SAR ADCs was fabricated using 0.18 μm CMOS process. The measurement results shows that the proposed multiple sampling method reduces each A/D conversion time from 1.2 μs to 0.45 μs and random noise from 848.3 μV to 270.4 μV, achieving a dynamic range of 68.1 dB and an SNR of 39.2 dB. PMID:26712765

  7. A Fast Multiple Sampling Method for Low-Noise CMOS Image Sensors With Column-Parallel 12-bit SAR ADCs.

    PubMed

    Kim, Min-Kyu; Hong, Seong-Kwan; Kwon, Oh-Kyong

    2015-01-01

    This paper presents a fast multiple sampling method for low-noise CMOS image sensor (CIS) applications with column-parallel successive approximation register analog-to-digital converters (SAR ADCs). The 12-bit SAR ADC using the proposed multiple sampling method decreases the A/D conversion time by repeatedly converting a pixel output to 4-bit after the first 12-bit A/D conversion, reducing noise of the CIS by one over the square root of the number of samplings. The area of the 12-bit SAR ADC is reduced by using a 10-bit capacitor digital-to-analog converter (DAC) with four scaled reference voltages. In addition, a simple up/down counter-based digital processing logic is proposed to perform complex calculations for multiple sampling and digital correlated double sampling. To verify the proposed multiple sampling method, a 256 × 128 pixel array CIS with 12-bit SAR ADCs was fabricated using 0.18 μm CMOS process. The measurement results shows that the proposed multiple sampling method reduces each A/D conversion time from 1.2 μs to 0.45 μs and random noise from 848.3 μV to 270.4 μV, achieving a dynamic range of 68.1 dB and an SNR of 39.2 dB. PMID:26712765

  8. Mixed Linear/Square-Root Encoded Single Slope Ramp Provides a Fast, Low Noise Analog to Digital Converter with Very High Linearity for Focal Plane Arrays

    NASA Technical Reports Server (NTRS)

    Wrigley, Christopher James (Inventor); Hancock, Bruce R. (Inventor); Newton, Kenneth W. (Inventor); Cunningham, Thomas J. (Inventor)

    2014-01-01

    An analog-to-digital converter (ADC) converts pixel voltages from a CMOS image into a digital output. A voltage ramp generator generates a voltage ramp that has a linear first portion and a non-linear second portion. A digital output generator generates a digital output based on the voltage ramp, the pixel voltages, and comparator output from an array of comparators that compare the voltage ramp to the pixel voltages. A return lookup table linearizes the digital output values.

  9. Lower-Dark-Current, Higher-Blue-Response CMOS Imagers

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata; Cunningham, Thomas; Hancock, Bruce

    2008-01-01

    Several improved designs for complementary metal oxide/semiconductor (CMOS) integrated-circuit image detectors have been developed, primarily to reduce dark currents (leakage currents) and secondarily to increase responses to blue light and increase signal-handling capacities, relative to those of prior CMOS imagers. The main conclusion that can be drawn from a study of the causes of dark currents in prior CMOS imagers is that dark currents could be reduced by relocating p/n junctions away from Si/SiO2 interfaces. In addition to reflecting this conclusion, the improved designs include several other features to counteract dark-current mechanisms and enhance performance.

  10. CMOS imager for pointing and tracking applications

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata (Inventor); Sun, Chao (Inventor); Yang, Guang (Inventor); Heynssens, Julie B. (Inventor)

    2006-01-01

    Systems and techniques to realize pointing and tracking applications with CMOS imaging devices. In general, in one implementation, the technique includes: sampling multiple rows and multiple columns of an active pixel sensor array into a memory array (e.g., an on-chip memory array), and reading out the multiple rows and multiple columns sampled in the memory array to provide image data with reduced motion artifact. Various operation modes may be provided, including TDS, CDS, CQS, a tracking mode to read out multiple windows, and/or a mode employing a sample-first-read-later readout scheme. The tracking mode can take advantage of a diagonal switch array. The diagonal switch array, the active pixel sensor array and the memory array can be integrated onto a single imager chip with a controller. This imager device can be part of a larger imaging system for both space-based applications and terrestrial applications.

  11. Latchup in CMOS devices from heavy ions

    NASA Technical Reports Server (NTRS)

    Soliman, K.; Nichols, D. K.

    1983-01-01

    It is noted that complementary metal oxide semiconductor (CMOS) microcircuits are inherently latchup prone. The four-layer n-p-n-p structures formed from the parasitic pnp and npn transistors make up a silicon controlled rectifier. If properly biased, this rectifier may be triggered 'ON' by electrical transients, ionizing radiation, or a single heavy ion. This latchup phenomenon might lead to a loss of functionality or device burnout. Results are presented from tests on 19 different device types from six manufacturers which investigate their latchup sensitivity with argon and krypton beams. The parasitic npnp paths are identified in general, and a qualitative rationale is given for latchup susceptibility, along with a latchup cross section for each type of device. Also presented is the correlation between bit-flip sensitivity and latchup susceptibility.

  12. Photocurrent estimation from multiple nondestructive samples in CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Liu, Xinqiao; El Gamal, Abbas

    2001-05-01

    CMOS image sensors generally suffer form lower dynamic range than CCDs due to their higher readout noise. Their high speed readout capability and the potential of integrating memory and signal processing with the sensor on the same chip, open up many possibilities for enhancing their dynamic range. Earlier work have demonstrated the use of multiple non-destructive samples to enhance dynamic range, while achieving higher SNR than using other dynamic range enhancement schemes. The high dynamic range image is constructed by appropriately scaling each pixel's last sample before saturation. Conventional CDS is used to reduce offset FPN and reset noise. This simple high dynamic range image construction scheme, however, does not take full advantage of the multiple samples. Readout noise power, which doubles as a result of performing CDS, remain as high as in conventional sensor operation. As a result dynamic range is only extended at the high illumination end. The paper explores the use of linear mean-square-error estimation to more fully exploit the multiple pixel samples to reduce readout noise and thus extend dynamic range at the low illumination end. We present three estimation algorithms: (1) a recursive estimator when reset noise and offset FPN are ignored, (2) a non-recursive algorithm when reset noise and FPN are considered, and (3) a recursive estimation algorithm for case (2), which achieves mean square error close to the non-recursive algorithm without the need to store all the samples. The later recursive algorithm is attractive since it requires the storage of only a few pixel values per pixel, which makes its implementation in a single chip digital imaging system feasible.

  13. CMOS image sensor with contour enhancement

    NASA Astrophysics Data System (ADS)

    Meng, Liya; Lai, Xiaofeng; Chen, Kun; Yuan, Xianghui

    2010-10-01

    Imitating the signal acquisition and processing of vertebrate retina, a CMOS image sensor with bionic pre-processing circuit is designed. Integration of signal-process circuit on-chip can reduce the requirement of bandwidth and precision of the subsequent interface circuit, and simplify the design of the computer-vision system. This signal pre-processing circuit consists of adaptive photoreceptor, spatial filtering resistive network and Op-Amp calculation circuit. The adaptive photoreceptor unit with a dynamic range of approximately 100 dB has a good self-adaptability for the transient changes in light intensity instead of intensity level itself. Spatial low-pass filtering resistive network used to mimic the function of horizontal cell, is composed of the horizontal resistor (HRES) circuit and OTA (Operational Transconductance Amplifier) circuit. HRES circuit, imitating dendrite of the neuron cell, comprises of two series MOS transistors operated in weak inversion region. Appending two diode-connected n-channel transistors to a simple transconductance amplifier forms the OTA Op-Amp circuit, which provides stable bias voltage for the gate of MOS transistors in HRES circuit, while serves as an OTA voltage follower to provide input voltage for the network nodes. The Op-Amp calculation circuit with a simple two-stage Op-Amp achieves the image contour enhancing. By adjusting the bias voltage of the resistive network, the smoothing effect can be tuned to change the effect of image's contour enhancement. Simulations of cell circuit and 16×16 2D circuit array are implemented using CSMC 0.5μm DPTM CMOS process.

  14. A CMOS wireless biomolecular sensing system-on-chip based on polysilicon nanowire technology.

    PubMed

    Huang, C-W; Huang, Y-J; Yen, P-W; Tsai, H-H; Liao, H-H; Juang, Y-Z; Lu, S-S; Lin, C-T

    2013-11-21

    As developments of modern societies, an on-field and personalized diagnosis has become important for disease prevention and proper treatment. To address this need, in this work, a polysilicon nanowire (poly-Si NW) based biosensor system-on-chip (bio-SSoC) is designed and fabricated by a 0.35 μm 2-Poly-4-Metal (2P4M) complementary metal-oxide-semiconductor (CMOS) process provided by a commercialized semiconductor foundry. Because of the advantages of CMOS system-on-chip (SoC) technologies, the poly-Si NW biosensor is integrated with a chopper differential-difference amplifier (DDA) based analog-front-end (AFE), a successive approximation analog-to-digital converter (SAR ADC), and a microcontroller to have better sensing capabilities than a traditional Si NW discrete measuring system. In addition, an on-off key (OOK) wireless transceiver is also integrated to form a wireless bio-SSoC technology. This is pioneering work to harness the momentum of CMOS integrated technology into emerging bio-diagnosis technologies. This integrated technology is experimentally examined to have a label-free and low-concentration biomolecular detection for both Hepatitis B Virus DNA (10 fM) and cardiac troponin I protein (3.2 pM). Based on this work, the implemented wireless bio-SSoC has demonstrated a good biomolecular sensing characteristic and a potential for low-cost and mobile applications. As a consequence, this developed technology can be a promising candidate for on-field and personalized applications in biomedical diagnosis. PMID:24080725

  15. CMOS Image Sensor and System for Imaging Hemodynamic Changes in Response to Deep Brain Stimulation.

    PubMed

    Zhang, Xiao; Noor, Muhammad S; McCracken, Clinton B; Kiss, Zelma H T; Yadid-Pecht, Orly; Murari, Kartikeya

    2016-06-01

    Deep brain stimulation (DBS) is a therapeutic intervention used for a variety of neurological and psychiatric disorders, but its mechanism of action is not well understood. It is known that DBS modulates neural activity which changes metabolic demands and thus the cerebral circulation state. However, it is unclear whether there are correlations between electrophysiological, hemodynamic and behavioral changes and whether they have any implications for clinical benefits. In order to investigate these questions, we present a miniaturized system for spectroscopic imaging of brain hemodynamics. The system consists of a 144 ×144, [Formula: see text] pixel pitch, high-sensitivity, analog-output CMOS imager fabricated in a standard 0.35 μm CMOS process, along with a miniaturized imaging system comprising illumination, focusing, analog-to-digital conversion and μSD card based data storage. This enables stand alone operation without a computer, nor electrical or fiberoptic tethers. To achieve high sensitivity, the pixel uses a capacitive transimpedance amplifier (CTIA). The nMOS transistors are in the pixel while pMOS transistors are column-parallel, resulting in a fill factor (FF) of 26%. Running at 60 fps and exposed to 470 nm light, the CMOS imager has a minimum detectable intensity of 2.3 nW/cm(2) , a maximum signal-to-noise ratio (SNR) of 49 dB at 2.45 μW/cm(2) leading to a dynamic range (DR) of 61 dB while consuming 167 μA from a 3.3 V supply. In anesthetized rats, the system was able to detect temporal, spatial and spectral hemodynamic changes in response to DBS. PMID:26357405

  16. Digital Libraries.

    ERIC Educational Resources Information Center

    Fox, Edward A.; Urs, Shalini R.

    2002-01-01

    Provides an overview of digital libraries research, practice, and literature. Highlights include new technologies; redefining roles; historical background; trends; creating digital content, including conversion; metadata; organizing digital resources; services; access; information retrieval; searching; natural language processing; visualization;…

  17. Depleted CMOS pixels for LHC proton-proton experiments

    NASA Astrophysics Data System (ADS)

    Wermes, N.

    2016-07-01

    While so far monolithic pixel detectors have remained in the realm of comparatively low rate and radiation applications outside LHC, new developments exploiting high resistivity substrates with three or four well CMOS process options allow reasonably large depletion depths and full CMOS circuitry in a monolithic structure. This opens up the possibility to target CMOS pixel detectors also for high radiation pp-experiments at the LHC upgrade, either in a hybrid-type fashion or even fully monolithic. Several pixel matrices have been prototyped with high ohmic substrates, high voltage options, and full CMOS electronics. They were characterized in the lab and in test beams. An overview of the necessary development steps and different approaches as well as prototype results are presented in this paper.

  18. CMOS Active Pixel Sensor Technology and Reliability Characterization Methodology

    NASA Technical Reports Server (NTRS)

    Chen, Yuan; Guertin, Steven M.; Pain, Bedabrata; Kayaii, Sammy

    2006-01-01

    This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers.

  19. CMOS monolithic pixel sensors research and development at LBNL

    NASA Astrophysics Data System (ADS)

    Contarato, D.; Bussat, J.-M.; Denes, P.; Greiner, L.; Kim, T.; Stezelberger, T.; Wieman, H.; Battaglia, M.; Hooberman, B.; Tompkins, L.

    2007-12-01

    This paper summarizes the recent progress in the design and characterization of CMOS pixel sensors at LBNL. Results of lab tests, beam tests and radiation hardness tests carried out at LBNL on a test structure with pixels of various sizes are reported. The first results of the characterization of back-thinned CMOS pixel sensors are also reported, and future plans and activities are discussed.

  20. OLED-on-CMOS integration for optoelectronic sensor applications

    NASA Astrophysics Data System (ADS)

    Vogel, Uwe; Kreye, Daniel; Reckziegel, Sven; Törker, Michael; Grillberger, Christiane; Amelung, Jörg

    2007-02-01

    Highly-efficient, low-voltage organic light emitting diodes (OLEDs) are well suitable for post-processing integration onto the top metal layer of CMOS devices. This has been proven for OLED microdisplays so far. Moreover, OLEDon- CMOS technology may also be excellently suitable for various optoelectronic sensor applications by combining highly efficient emitters, use of low-cost materials and cost-effective manufacturing together with silicon-inherent photodetectors and CMOS circuitry. The use of OLEDs on CMOS substrates requires a top-emitting, low-voltage and highly efficient OLED structure. By reducing the operating voltage for the OLED below 5V, the costs for the CMOS process can be reduced, because a process without high-voltage option can be used. Red, orange, white, green and blue OLED-stacks with doped charge transport layers were prepared on different dualmetal layer CMOS test substrates without active transistor area. Afterwards, the different devices were measured and compared with respect to their performance (current, luminance, voltage, luminance dependence on viewing angle, optical outcoupling etc.). Low operating voltages of 2.4V at 100cd/m2 for the red p-i-n type phosphorescent emitting OLED stack, 2.5V at 100cd/m2 for the orange phosphorescent emitting OLED stack and 3.2V at 100cd/m2 for the white fluorescent emitting OLED have been achieved here. Therefore, those OLED stacks are suitable for use in a CMOS process even within a regular 5V process option. Moreover, the operating voltage achieved so far is expected to be reduced further when using different top electrode materials. Integrating such OLEDs on a CMOS-substrate provide a preferable choice for silicon-based optical microsystems targeted towards optoelectronic sensor applications, as there are integrated light barriers, optocouplers, or lab-onchip devices.

  1. Delta Doping High Purity CCDs and CMOS for LSST

    NASA Technical Reports Server (NTRS)

    Blacksberg, Jordana; Nikzad, Shouleh; Hoenk, Michael; Elliott, S. Tom; Bebek, Chris; Holland, Steve; Kolbe, Bill

    2006-01-01

    A viewgraph presentation describing delta doping high purity CCD's and CMOS for LSST is shown. The topics include: 1) Overview of JPL s versatile back-surface process for CCDs and CMOS; 2) Application to SNAP and ORION missions; 3) Delta doping as a back-surface electrode for fully depleted LBNL CCDs; 4) Delta doping high purity CCDs for SNAP and ORION; 5) JPL CMP thinning process development; and 6) Antireflection coating process development.

  2. CMOS front end electronics for the ATLAS muon detector

    SciTech Connect

    Huth, J.; Oliver, J.; Hazen, E.; Shank, J.

    1997-12-31

    An all-CMOS design for an integrated ASD (Amplifier-Shaper-Discriminator) chip for readout of the ATLAS Monitored Drift Tubes (MDTs) is presented. Eight channels of charge-sensitive preamp, two-stage pole/zero shaper, Wilkinson ADC and discriminator with programmable hysteresis are integrated on a single IC. Key elements have been prototyped in 1.2 and 0.5 micron CMOS operating at 5V and 3.3V respectively.

  3. Advancement of CMOS Doping Technology in an External Development Framework

    NASA Astrophysics Data System (ADS)

    Jain, Amitabh; Chambers, James J.; Shaw, Judy B.

    2011-01-01

    The consumer appetite for a rich multimedia experience drives technology development for mobile hand-held devices and the infrastructure to support them. Enhancements in functionality, speed, and user experience are derived from advancements in CMOS technology. The technical challenges in developing each successive CMOS technology node to support these enhancements have become increasingly difficult. These trends have motivated the CMOS business towards a collaborative approach based on strategic partnerships. This paper describes our model and experience of CMOS development, based on multi-dimensional industrial and academic partnerships. We provide to our process equipment, materials, and simulation partners, as well as to our silicon foundry partners, the detailed requirements for future integrated circuit products. This is done very early in the development cycle to ensure that these requirements can be met. In order to determine these fundamental requirements, we rely on a strategy that requires strong interaction between process and device simulation, physical and chemical analytical methods, and research at academic institutions. This learning is shared with each project partner to address integration and manufacturing issues encountered during CMOS technology development from its inception through product ramp. We utilize TI's core strengths in physical analysis, unit processes and integration, yield ramp, reliability, and product engineering to support this technological development. Finally, this paper presents examples of the advancement of CMOS doping technology for the 28 nm node and beyond through this development model.

  4. A 15-bit incremental sigma-delta ADC for CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Chen, Nan; Li, Zhengfen; Zhong, Shengyou; Zou, Mei; Yao, Libin

    2015-04-01

    An incremental sigma-delta ADC is designed for column-parallel ADC array in CMOS image sensor. Sigma-delta modulator with single-loop single-bit structure is chosen for power consumption and performance reasons. Second-order modulator is used to reduce conversion time, without stability problem and large area accompanied by higher order sigma-delta modulator. The asymmetric current mirror amplifier used in integrator reduces more than 30% power dissipation. The digital filter and decimator are implemented by counters and adders with significantly reduced chip area and power consumption. A Clock generator is shared by 8 ADCs for trade-off among power, area and clock loading. The ADC array is implemented in a 0.18-μm CMOS technology and clocked at 10 MHz, and the simulated resolution achieves 15-bit with 255 clock cycles. The average power consumption per ADC is 118 μW including clock generator, and the area is only 0.0053 μm2.

  5. A low-power column-parallel ADC for high-speed CMOS image sensor

    NASA Astrophysics Data System (ADS)

    Han, Ye; Li, Quanliang; Shi, Cong; Liu, Liyuan; Wu, Nanjian

    2013-08-01

    This paper presents a 10-bit low-power column-parallel cyclic analog-to-digital converter (ADC) used for high-speed CMOS image sensor (CIS). An opamp sharing technique is used to save power and area. Correlated double sampling (CDS) circuit and programmable gain amplifier (PGA) are integrated in the ADC, which avoids stand-alone circuit blocks. An offset cancellation technique is also introduced, which reduces the column fixed-pattern noise (FPN) effectively. One single channel ADC with an area less than 0.03mm2 was implemented in a 0.18μm 1P4M CMOS image sensor process. The resolution of the proposed ADC is 10-bit, and the conversion rate is 2MS/s. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.62 LSB and 2.1 LSB together with CDS, respectively. The power consumption from 1.8V supply is only 0.36mW.

  6. A 3.1-4.8 GHz CMOS receiver for MB-OFDM UWB

    NASA Astrophysics Data System (ADS)

    Guang, Yang; Wang, Yao; Jiangwei, Yin; Renliang, Zheng; Wei, Li; Ning, Li; Junyan, Ren

    2009-01-01

    An integrated fully differential ultra-wideband CMOS receiver for 3.1-4.8 GHz MB-OFDM systems is presented. A gain controllable low noise amplifier and a merged quadrature mixer are integrated as the RF front-end. Five order Gm-C type low pass filters and VGAs are also integrated for both I and Q IF paths in the receiver. The ESD protected chip is fabricated in a Jazz 0.18 μm RF CMOS process and achieves a maximum total voltage gain of 65 dB, an AGC range of 45 dB with about 6 dB/step, an averaged total noise figure of 6.4 to 8.8 dB over 3 bands and an in-band IIP3 of -5.1 dBm. The receiver occupies 2.3 mm2 and consumes 110 mA from a 1.8 V supply including test buffers and a digital module.

  7. A CMOS pressure sensor with integrated interface for passive RFID applications

    NASA Astrophysics Data System (ADS)

    Deng, Fangming; He, Yigang; Wu, Xiang; Fu, Zhihui

    2014-12-01

    This paper presents a CMOS pressure sensor with integrated interface for passive RFID sensing applications. The pressure sensor consists of three parts: top electrode, dielectric layer and bottom electrode. The dielectric layer consists of silicon oxide and an air gap. The bottom electrode is made of polysilicon. The gap is formed by sacrificial layer release and the Al vapor process is used to seal the gap and form the top electrode. The sensor interface is based on phase-locked architecture, which allows the use of fully digital blocks. The proposed pressure sensor and interface is fabricated in a 0.18 μm CMOS process. The measurement results show the pressure sensor achieves excellent linearity with a sensitivity of 1.2 fF kPa-1. The sensor interface consumes only 1.1 µW of power at 0.5 V voltage supply, which is at least an order of magnitude better than state-of-the-art designs.

  8. CMOS Amperometric ADC With High Sensitivity, Dynamic Range and Power Efficiency for Air Quality Monitoring.

    PubMed

    Li, Haitao; Boling, C Sam; Mason, Andrew J

    2016-08-01

    Airborne pollutants are a leading cause of illness and mortality globally. Electrochemical gas sensors show great promise for personal air quality monitoring to address this worldwide health crisis. However, implementing miniaturized arrays of such sensors demands high performance instrumentation circuits that simultaneously meet challenging power, area, sensitivity, noise and dynamic range goals. This paper presents a new multi-channel CMOS amperometric ADC featuring pixel-level architecture for gas sensor arrays. The circuit combines digital modulation of input currents and an incremental Σ∆ ADC to achieve wide dynamic range and high sensitivity with very high power efficiency and compact size. Fabricated in 0.5 [Formula: see text] CMOS, the circuit was measured to have 164 dB cross-scale dynamic range, 100 fA sensitivity while consuming only 241 [Formula: see text] and 0.157 [Formula: see text] active area per channel. Electrochemical experiments with liquid and gas targets demonstrate the circuit's real-time response to a wide range of analyte concentrations. PMID:27352395

  9. A CMOS pixel sensor prototype for the outer layers of linear collider vertex detector

    NASA Astrophysics Data System (ADS)

    Zhang, L.; Morel, F.; Hu-Guo, C.; Himmi, A.; Dorokhov, A.; Hu, Y.

    2015-01-01

    The International Linear Collider (ILC) expresses a stringent requirement for high precision vertex detectors (VXD). CMOS pixel sensors (CPS) have been considered as an option for the VXD of the International Large Detector (ILD), one of the detector concepts proposed for the ILC. MIMOSA-31 developed at IPHC-Strasbourg is the first CPS integrated with 4-bit column-level ADC for the outer layers of the VXD, adapted to an original concept minimizing the power consumption. It is composed of a matrix of 64 rows and 48 columns. The pixel concept combines in-pixel amplification with a correlated double sampling (CDS) operation in order to reduce the temporal noise and fixed pattern noise (FPN). At the bottom of the pixel array, each column is terminated with a self-triggered analog-to-digital converter (ADC). The ADC design was optimized for power saving at a sampling frequency of 6.25 MS/s. The prototype chip is fabricated in a 0.35 μm CMOS technology. This paper presents the details of the prototype chip and its test results.

  10. A Low-power CMOS BFSK Transceiver for Health Monitoring Systems

    PubMed Central

    Kim, Sungho; Lepkowski, William; Wilk, Seth J.; Thornton, Trevor J.; Bakkaloglu, Bertan

    2014-01-01

    A CMOS low-power transceiver for implantable and external health monitoring devices operating in the MICS band is presented. The LNA core has an integrated mixer in a folded configuration to reuse the bias current, allowing high linearity with a low power supply levels. The baseband strip consists of a pseudo differential MOS-C band-pass filter achieving demodulation of 150kHz-offset BFSK signals. An all digital frequency-locked loop is used for LO generation in the RX mode and for driving a class AB power amplifier in the TX mode. The MICS transceiver is designed and fabricated in a 0.18μm 1-poly, 6-metal CMOS process. The sensitivities of −70dBm and −98dBm were achieved with NF of 40dB and 11dB at the data rate of 100kb/s while consuming only 600μW and 1.5mW at 1.2V and 1.8V, respectively. The BERs are less than 10−3 at the input powers of −70dBm at 1.2V and −98dBm at 1.8V at the data rate of 100kb/s. Finally, the output power of the transmitter is 0dBm for a power consumption of 1.8mW. PMID:24473462

  11. A Low-power CMOS BFSK Transceiver for Health Monitoring Systems.

    PubMed

    Kim, Sungho; Lepkowski, William; Wilk, Seth J; Thornton, Trevor J; Bakkaloglu, Bertan

    2011-01-01

    A CMOS low-power transceiver for implantable and external health monitoring devices operating in the MICS band is presented. The LNA core has an integrated mixer in a folded configuration to reuse the bias current, allowing high linearity with a low power supply levels. The baseband strip consists of a pseudo differential MOS-C band-pass filter achieving demodulation of 150kHz-offset BFSK signals. An all digital frequency-locked loop is used for LO generation in the RX mode and for driving a class AB power amplifier in the TX mode. The MICS transceiver is designed and fabricated in a 0.18μm 1-poly, 6-metal CMOS process. The sensitivities of -70dBm and -98dBm were achieved with NF of 40dB and 11dB at the data rate of 100kb/s while consuming only 600μW and 1.5mW at 1.2V and 1.8V, respectively. The BERs are less than 10(-3) at the input powers of -70dBm at 1.2V and -98dBm at 1.8V at the data rate of 100kb/s. Finally, the output power of the transmitter is 0dBm for a power consumption of 1.8mW. PMID:24473462

  12. Analog CMOS peak detect and hold circuits. Part 2. The two-phase offset-free and derandomizing configuration

    NASA Astrophysics Data System (ADS)

    De Geronimo, Gianluigi; O'Connor, Paul; Kandasamy, Anand

    2002-05-01

    An analog CMOS peak detect and hold (PDH) circuit, which combines high speed and accuracy, rail-to-rail sensing and driving, low power, and buffering is presented. It is based on a configuration that cancels the major error sources of the classical CMOS PDH, including offset and common mode gain, by re-using the same amplifier for tracking, peak sensing, and output buffering. By virtue of its high absolute accuracy, two or more PDHs can be used in parallel to serve as a data-driven analog memory for derandomization. The first experimental results on the new peak detector and derandomizer (PDD) circuit, fabricated in 0.35 μm CMOS technology, include a 0.2% absolute accuracy for pulses with 500 ns peaking time, 2.7 V linear input range, 3.3 mW power dissipation, 250 mV/s droop rate, and negligible dead time. The use of such a high performance analog PDD can greatly relax the requirements on the digitization in multi-channel systems.

  13. A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors

    PubMed Central

    Gao, Zhiyuan; Yang, Congjie; Xu, Jiangtao; Nie, Kaiming

    2015-01-01

    This paper presents a dynamic range (DR) enhanced readout technique with a two-step time-to-digital converter (TDC) for high speed linear CMOS image sensors. A multi-capacitor and self-regulated capacitive trans-impedance amplifier (CTIA) structure is employed to extend the dynamic range. The gain of the CTIA is auto adjusted by switching different capacitors to the integration node asynchronously according to the output voltage. A column-parallel ADC based on a two-step TDC is utilized to improve the conversion rate. The conversion is divided into coarse phase and fine phase. An error calibration scheme is also proposed to correct quantization errors caused by propagation delay skew within −Tclk~+Tclk. A linear CMOS image sensor pixel array is designed in the 0.13 μm CMOS process to verify this DR-enhanced high speed readout technique. The post simulation results indicate that the dynamic range of readout circuit is 99.02 dB and the ADC achieves 60.22 dB SNDR and 9.71 bit ENOB at a conversion rate of 2 MS/s after calibration, with 14.04 dB and 2.4 bit improvement, compared with SNDR and ENOB of that without calibration. PMID:26561819

  14. A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors.

    PubMed

    Gao, Zhiyuan; Yang, Congjie; Xu, Jiangtao; Nie, Kaiming

    2015-01-01

    This paper presents a dynamic range (DR) enhanced readout technique with a two-step time-to-digital converter (TDC) for high speed linear CMOS image sensors. A multi-capacitor and self-regulated capacitive trans-impedance amplifier (CTIA) structure is employed to extend the dynamic range. The gain of the CTIA is auto adjusted by switching different capacitors to the integration node asynchronously according to the output voltage. A column-parallel ADC based on a two-step TDC is utilized to improve the conversion rate. The conversion is divided into coarse phase and fine phase. An error calibration scheme is also proposed to correct quantization errors caused by propagation delay skew within -T(clk)~+T(clk). A linear CMOS image sensor pixel array is designed in the 0.13 μm CMOS process to verify this DR-enhanced high speed readout technique. The post simulation results indicate that the dynamic range of readout circuit is 99.02 dB and the ADC achieves 60.22 dB SNDR and 9.71 bit ENOB at a conversion rate of 2 MS/s after calibration, with 14.04 dB and 2.4 bit improvement, compared with SNDR and ENOB of that without calibration. PMID:26561819

  15. A low-power and small-area column-level ADC for high frame-rate CMOS pixel sensor

    NASA Astrophysics Data System (ADS)

    Zhang, L.; Morel, F.; Hu-Guo, C.; Hu, Y.

    2014-07-01

    CMOS pixel sensors (CPS) have demonstrated performances meeting the specifications of the International Linear Collider (ILC) vertex detector (VTX). This paper presents a low-power and small-area 4-bit column-level analog-to-digital converter (ADC) for CMOS pixel sensors. The ADC employs a self-timed trigger and completes the conversion by performing a multi-bit/step approximation. As in the outer layers of the ILC vertex detector hit density is of the order of a few per thousand, in order to reduce power consumption, the ADC is designed to work in two modes: active mode and idle mode. The ADC is fabricated in a 0.35 μm CMOS process with a pixel pitch of 35 μm. It is implemented with 48 columns in a sensor prototype. Each column ADC covers an area of 35 ×545 μm2. The measured temporal noise and Fixed Pattern Noise (FPN) are 0.96 mV and 0.40 mV, respectively. The power consumption, for a 3 V supply and 6.25 MS/s sampling rate, is 486 μW during idle time, which is by far the most frequently employed one. This value rises to 714 μW in the case of the active mode. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.49/-0.28 LSB and 0.29/-0.20 LSB, respectively.

  16. Studies for a 10 μs, thin, high resolution CMOS pixel sensor for future vertex detectors

    NASA Astrophysics Data System (ADS)

    Voutsinas, G.; Amar-Youcef, S.; Baudot, J.; Bertolone, G.; Brogna, A.; Chon-Sen, N.; Claus, G.; Colledani, C.; Dorokhov, A.; Dozière, G.; Dulinski, W.; Degerli, Y.; De Masi, R.; Deveaux, M.; Gelin, M.; Goffe, M.; Hu-Guo, Ch.; Himmi, A.; Jaaskelainen, K.; Koziel, M.; Morel, F.; Müntz, C.; Orsini, F.; Santos, C.; Schrader, C.; Specht, M.; Stroth, J.; Valin, I.; Wagner, F. M.; Winter, M.

    2011-06-01

    Future high energy physics (HEP) experiments require detectors with unprecedented performances for track and vertex reconstruction. These requirements call for high precision sensors, with low material budget and short integration time. The development of CMOS sensors for HEP applications was initiated at IPHC Strasbourg more than 10 years ago, motivated by the needs for vertex detectors at the International Linear Collider (ILC) [R. Turchetta et al, NIM A 458 (2001) 677]. Since then several other applications emerged. The first real scale digital CMOS sensor MIMOSA26 equips Flavour Tracker at RHIC, as well as for the microvertex detector of the CBM experiment at FAIR. MIMOSA sensors may also offer attractive performances for the ALICE upgrade at LHC. This paper will demonstrate the substantial performance improvement of CMOS sensors based on a high resistivity epitaxial layer. First studies for integrating the sensors into a detector system will be addressed and finally the way to go to a 10 μs readout sensor will be discussed.

  17. Image Quality Assessment of a CMOS/Gd2O2S:Pr,Ce,F X-ray Sensor

    NASA Astrophysics Data System (ADS)

    Michail, C. M.; Seferis, I. E.; Sideras, T.; Valais, I. G.; Fountos, G. P.; Bakas, A.; Panayiotakis, G. S.; Kandarakis, I. S.

    2015-09-01

    The aim of the present study was to examine the image quality performance of a CMOS digital imaging optical sensor coupled to custom made gadolinium oxysulfide powder scintillators, doped with praseodymium, cerium and fluorine (Gd2O2S:Pr,Ce,F) screens. The screens, with coating thicknesses 35.7 and 71.2 mg/cm2, were prepared in our laboratory from Gd2O2S:Pr,Ce,F powder (Phosphor Technology, Ltd) by sedimentation on silica substrates and were placed in direct contact with the optical sensor. Image quality was determined through a single index image quality parameter (information capacity). The CMOS sensor/Gd2O2S:Pr,Ce,F screens combinations were irradiated under the RQA-5 (IEC 62220-1) beam quality. The detector response function was linear for the exposure range under investigation. Under the general radiography conditions, both Gd2O2S:Pr,Ce,F screen/CMOS combinations exhibited comparable overall imaging properties, in terms of the information capacity, to previously published scintillators, such as Gd2O2S:Eu.

  18. Novel CMOS time-delay integration using single-photon counting for high-speed industrial and aerospace applications

    NASA Astrophysics Data System (ADS)

    El-Desouki, Munir M.; Al-Azem, Badeea

    2014-03-01

    Time-delay integration (TDI) is a popular imaging technique that is used in many applications such as machine vision, dental scanning and satellite earth observation. One of the main advantages of using TDI imagers is the increased effective integration time that is achieved while maintaining high frame-rates. Another use for TDI imagers is with moving objects, such as the earth's surface or industrial machine vision applications, where integration time is limited in order to avoid motion blurs. Such technique may even find its way in mobile and consumer based imaging applications where the reduction in pixel size can limit the performance during low-light and high speed applications. Until recently, TDI was only used with charge-coupled devices (CCDs) mainly due to their charge transfer characteristics. CCDs however, are power consuming and slow when compared to CMOS technology and are no longer favorable for mobile applications. In this work, we report on novel single-photon counting based TDI technique that is implemented in standard CMOS technology allowing for complete camera-on-a-chip solution. The imager was fabricated in a standard CMOS 150 nm 5-metal digital process from LFoundry.

  19. Binary CMOS image sensor with a gate/body-tied MOSFET-type photodetector for high-speed operation

    NASA Astrophysics Data System (ADS)

    Choi, Byoung-Soo; Jo, Sung-Hyun; Bae, Myunghan; Kim, Sang-Hwan; Shin, Jang-Kyoo

    2016-05-01

    In this paper, a binary complementary metal oxide semiconductor (CMOS) image sensor with a gate/body-tied (GBT) metal oxide semiconductor field effect transistor (MOSFET)-type photodetector is presented. The sensitivity of the GBT MOSFET-type photodetector, which was fabricated using the standard CMOS 0.35-μm process, is higher than the sensitivity of the p-n junction photodiode, because the output signal of the photodetector is amplified by the MOSFET. A binary image sensor becomes more efficient when using this photodetector. Lower power consumptions and higher speeds of operation are possible, compared to the conventional image sensors using multi-bit analog to digital converters (ADCs). The frame rate of the proposed image sensor is over 2000 frames per second, which is higher than those of the conventional CMOS image sensors. The output signal of an active pixel sensor is applied to a comparator and compared with a reference level. The 1-bit output data of the binary process is determined by this level. To obtain a video signal, the 1-bit output data is stored in the memory and is read out by horizontal scanning. The proposed chip is composed of a GBT pixel array (144 × 100), binary-process circuit, vertical scanner, horizontal scanner, and readout circuit. The operation mode can be selected from between binary mode and multi-bit mode.

  20. Digital Preservation.

    ERIC Educational Resources Information Center

    Yakel, Elizabeth

    2001-01-01

    Reviews research on digital preservation issues, including born-digital and digitally recreated documents. Discusses electronic records research; metadata and other standards; electronic mail; Web-based documents; moving images media; selection of materials for digitization, including primary sources; administrative issues; media stability…

  1. Large area CMOS bio-pixel array for compact high sensitive multiplex biosensing.

    PubMed

    Sandeau, Laure; Vuillaume, Cassandre; Contié, Sylvain; Grinenval, Eva; Belloni, Federico; Rigneault, Hervé; Owens, Roisin M; Fournet, Margaret Brennan

    2015-02-01

    A novel CMOS bio-pixel array which integrates assay substrate and assay readout is demonstrated for multiplex and multireplicate detection of a triplicate of cytokines with single digit pg ml(-1) sensitivities. Uniquely designed large area bio-pixels enable individual assays to be dedicated to and addressed by single pixels. A capability to simultaneously measure a large number of targets is provided by the 128 available pixels. Chemiluminescent assays are carried out directly on the pixel surface which also detects the emitted chemiluminescent photons, facilitating a highly compact sensor and reader format. The high sensitivity of the bio-pixel array is enabled by the high refractive index of silicon based pixels. This in turn generates a strong supercritical angle luminescence response significantly increasing the efficiency of the photon collection over conventional farfield modalities. PMID:25490928

  2. Integrating Metal-Oxide-Decorated CNT Networks with a CMOS Readout in a Gas Sensor

    PubMed Central

    Lee, Hyunjoong; Lee, Sanghoon; Kim, Dai-Hong; Perello, David; Park, Young June; Hong, Seong-Hyeon; Yun, Minhee; Kim, Suhwan

    2012-01-01

    We have implemented a tin-oxide-decorated carbon nanotube (CNT) network gas sensor system on a single die. We have also demonstrated the deposition of metallic tin on the CNT network, its subsequent oxidation in air, and the improvement of the lifetime of the sensors. The fabricated array of CNT sensors contains 128 sensor cells for added redundancy and increased accuracy. The read-out integrated circuit (ROIC) was combined with coarse and fine time-to-digital converters to extend its resolution in a power-efficient way. The ROIC is fabricated using a 0.35 μm CMOS process, and the whole sensor system consumes 30 mA at 5 V. The sensor system was successfully tested in the detection of ammonia gas at elevated temperatures. PMID:22736966

  3. Fluorescence suppression in Raman spectroscopy using a time-gated CMOS SPAD.

    PubMed

    Kostamovaara, Juha; Tenhunen, Jussi; Kögler, Martin; Nissinen, Ilkka; Nissinen, Jan; Keränen, Pekka

    2013-12-16

    A Raman spectrometer technique is described that aims at suppressing the fluorescence background typical of Raman spectra. The sample is excited with a high power (65W), short (300ps) laser pulse and the time position of each of the Raman scattered photons with respect to the excitation is measured with a CMOS SPAD detector and an accurate time-to-digital converter at each spectral point. It is shown by means of measurements performed on an olive oil sample that the fluorescence background can be greatly suppressed if the sample response is recorded only for photons coinciding with the laser pulse. A further correction in the residual fluorescence baseline can be achieved using the measured fluorescence tails at each of the spectral points. PMID:24514736

  4. Time-resolved Förster-resonance-energy-transfer DNA assay on an active CMOS microarray

    PubMed Central

    Schwartz, David Eric; Gong, Ping; Shepard, Kenneth L.

    2008-01-01

    We present an active oligonucleotide microarray platform for time-resolved Förster resonance energy transfer (TR-FRET) assays. In these assays, immobilized probe is labeled with a donor fluorophore and analyte target is labeled with a fluorescence quencher. Changes in the fluorescence decay lifetime of the donor are measured to determine the extent of hybridization. In this work, we demonstrate that TR-FRET assays have reduced sensitivity to variances in probe surface density compared with standard fluorescence-based microarray assays. Use of an active array substrate, fabricated in a standard complementary metal-oxide-semiconductor (CMOS) process, provides the additional benefits of reduced system complexity and cost. The array consists of 4096 independent single-photon avalanche diode (SPAD) pixel sites and features on-chip time-to-digital conversion. We demonstrate the functionality of our system by measuring a DNA target concentration series using TR-FRET with semiconductor quantum dot donors. PMID:18515059

  5. Adaptive Threshold Neural Spike Detector Using Stationary Wavelet Transform in CMOS.

    PubMed

    Yang, Yuning; Boling, C Sam; Kamboh, Awais M; Mason, Andrew J

    2015-11-01

    Spike detection is an essential first step in the analysis of neural recordings. Detection at the frontend eases the bandwidth requirement for wireless data transfer of multichannel recordings to extra-cranial processing units. In this work, a low power digital integrated spike detector based on the lifting stationary wavelet transform is presented and developed. By monitoring the standard deviation of wavelet coefficients, the proposed detector can adaptively set a threshold value online for each channel independently without requiring user intervention. A prototype 16-channel spike detector was designed and tested in an FPGA. The method enables spike detection with nearly 90% accuracy even when the signal-to-noise ratio is as low as 2. The design was mapped to 130 nm CMOS technology and shown to occupy 0.014 mm(2) of area and dissipate 1.7 μW of power per channel, making it suitable for implantable multichannel neural recording systems. PMID:25955990

  6. A CMOS variable gain amplifier for PHENIX electromagnetic calorimeter and RICH energy measurements

    SciTech Connect

    Wintenberg, A.L.; Simpson, M.L.; Young, G.R.; Palmer, R.L.; Moscone, C.G.; Jackson, R.G.

    1996-12-31

    A variable gain amplifier (VGA) has been developed equalizing the gains of integrating amplifier channels used with multiple photomultiplier tubes operating from common high-voltage supplies. The PHENIX lead-scintillator electromagnetic calorimeter will operate in that manner, and gain equalization is needed to preserve the dynamic range of the analog memory and ADC following the integrating amplifier. The VGA is also needed for matching energy channel gains prior to forming analog sums for trigger purposes. The gain of the VGA is variable over a 3:1 range using a 5-bit digital control, and the risetime is held between 15 and 23 ns using switched compensation in the VGA. An additional feature is gated baseline restoration. Details of the design and results from several prototype devices fabricated in 1.2-{mu}m Orbit CMOS are presented.

  7. 1-Grad total dose evaluation of 65 nm CMOS technology for the HL-LHC upgrades

    NASA Astrophysics Data System (ADS)

    Menouni, M.; Barbero, M.; Bompard, F.; Bonacini, S.; Fougeron, D.; Gaglione, R.; Rozanov, A.; Valerio, P.; Wang, A.

    2015-05-01

    The radiation tolerance of 65 nm bulk CMOS devices was investigated using 10 keV X-rays up to a Total Ionizing Dose (TID) of 1 Grad. Irradiation tests were performed at room temperature (25°C) as well as at low temperature (-15°C). The implications on the DC performance of n and p channel transistors are presented. For small size devices, a strong performance degradation is observed from a dose of 100 Mrad. Irradiations made at room temperature up to 1 Grad show a complete drive loss in PMOS devices, due to decreasing transconductance. When the irradiation is conducted at -15°C, the devices show less radiation damage. Annealing helps recovering a small part of the drive capabilities of the small size devices, but the threshold voltage shift is still high and might compromise the operation in some digital applications.

  8. Integrating metal-oxide-decorated CNT networks with a CMOS readout in a gas sensor.

    PubMed

    Lee, Hyunjoong; Lee, Sanghoon; Kim, Dai-Hong; Perello, David; Park, Young June; Hong, Seong-Hyeon; Yun, Minhee; Kim, Suhwan

    2012-01-01

    We have implemented a tin-oxide-decorated carbon nanotube (CNT) network gas sensor system on a single die. We have also demonstrated the deposition of metallic tin on the CNT network, its subsequent oxidation in air, and the improvement of the lifetime of the sensors. The fabricated array of CNT sensors contains 128 sensor cells for added redundancy and increased accuracy. The read-out integrated circuit (ROIC) was combined with coarse and fine time-to-digital converters to extend its resolution in a power-efficient way. The ROIC is fabricated using a 0.35 μm CMOS process, and the whole sensor system consumes 30 mA at 5 V. The sensor system was successfully tested in the detection of ammonia gas at elevated temperatures. PMID:22736966

  9. 0.5 billion events per second time correlated single photon counting using CMOS SPAD arrays.

    PubMed

    Krstajić, Nikola; Poland, Simon; Levitt, James; Walker, Richard; Erdogan, Ahmet; Ameer-Beg, Simon; Henderson, Robert K

    2015-09-15

    We present a digital architecture for fast acquisition of time correlated single photon counting (TCSPC) events from a 32×32 complementary metal oxide semiconductor (CMOS) single photon avalanche detector (SPAD) array (Megaframe) to the computer memory. Custom firmware was written to transmit event codes from 1024-TCSPC-enabled pixels for fast transfer of TCSPC events. Our 1024-channel TCSPC system is capable of acquiring up to 0.5×10(9) TCSPC events per second with 16 histogram bins spanning a 14 ns width. Other options include 320×10(6) TCSPC events per second with 256 histogram bins spanning either a 14 or 56 ns time window. We present a wide-field fluorescence microscopy setup demonstrating fast fluorescence lifetime data acquisition. To the best of our knowledge, this is the fastest direct TCSPC transfer from a single photon counting device to the computer to date. PMID:26371922

  10. Focal-plane CMOS wavelet feature extraction for real-time pattern recognition

    NASA Astrophysics Data System (ADS)

    Olyaei, Ashkan; Genov, Roman

    2005-09-01

    Kernel-based pattern recognition paradigms such as support vector machines (SVM) require computationally intensive feature extraction methods for high-performance real-time object detection in video. The CMOS sensory parallel processor architecture presented here computes delta-sigma (ΔΣ)-modulated Haar wavelet transform on the focal plane in real time. The active pixel array is integrated with a bank of column-parallel first-order incremental oversampling analog-to-digital converters (ADCs). Each ADC performs distributed spatial focal-plane sampling and concurrent weighted average quantization. The architecture is benchmarked in SVM face detection on the MIT CBCL data set. At 90% detection rate, first-level Haar wavelet feature extraction yields a 7.9% reduction in the number of false positives when compared to classification with no feature extraction. The architecture yields 1.4 GMACS simulated computational throughput at SVGA imager resolution at 8-bit output depth.

  11. NSC 800, 8-bit CMOS microprocessor

    NASA Technical Reports Server (NTRS)

    Suszko, S. F.

    1984-01-01

    The NSC 800 is an 8-bit CMOS microprocessor manufactured by National Semiconductor Corp., Santa Clara, California. The 8-bit microprocessor chip with 40-pad pin-terminals has eight address buffers (A8-A15), eight data address -- I/O buffers (AD(sub 0)-AD(sub 7)), six interrupt controls and sixteen timing controls with a chip clock generator and an 8-bit dynamic RAM refresh circuit. The 22 internal registers have the capability of addressing 64K bytes of memory and 256 I/O devices. The chip is fabricated on N-type (100) silicon using self-aligned polysilicon gates and local oxidation process technology. The chip interconnect consists of four levels: Aluminum, Polysi 2, Polysi 1, and P(+) and N(+) diffusions. The four levels, except for contact interface, are isolated by interlevel oxide. The chip is packaged in a 40-pin dual-in-line (DIP), side brazed, hermetically sealed, ceramic package with a metal lid. The operating voltage for the device is 5 V. It is available in three operating temperature ranges: 0 to +70 C, -40 to +85 C, and -55 to +125 C. Two devices were submitted for product evaluation by F. Stott, MTS, JPL Microprocessor Specialist. The devices were pencil-marked and photographed for identification.

  12. Simulation of SEU transients in CMOS ICs

    SciTech Connect

    Kaul, N.; Bhuva, B.L.; Kerns, S.E. )

    1991-12-01

    This paper reports that available analytical models of the number of single-event-induced errors (SEU) in combinational logic systems are not easily applicable to real integrated circuits (ICs). An efficient computer simulation algorithm set, SITA, predicts the vulnerability of data stored in and processed by complex combinational logic circuits to SEU. SITA is described in detail to allow researchers to incorporate it into their error analysis packages. Required simulation algorithms are based on approximate closed-form equations modeling individual device behavior in CMOS logic units. Device-level simulation is used to estimate the probability that ion-device interactions produce erroneous signals capable of propagating to a latch (or n output node), and logic-level simulation to predict the spread of such erroneous, latched information through the IC. Simulation results are compared to those from SPICE for several circuit and logic configurations. SITA results are comparable to this established circuit-level code, and SITA can analyze circuits with state-of-the-art device densities (which SPICE cannot). At all IC complexity levels, SITAS offers several factors of 10 savings in simulation time over SPICE.

  13. A theoretical investigation of spectra utilization for a CMOS based indirect detector for dual energy applications

    NASA Astrophysics Data System (ADS)

    Kalyvas, N.; Martini, N.; Koukou, V.; Michail, C.; Sotiropoulou, P.; Valais, I.; Kandarakis, I.; Fountos, G.

    2015-09-01

    Dual Energy imaging is a promising method for visualizing masses and microcalcifications in digital mammography. Currently commercially available detectors may be suitable for dual energy mammographic applications. The scope of this work was to theoretically examine the performance of the Radeye CMOS digital indirect detector under three low- and high-energy spectral pairs. The detector was modeled through the linear system theory. The pixel size was equal to 22.5μm and the phosphor material of the detector was a 33.9 mg/cm2 Gd2O2S:Tb phosphor screen. The examined spectral pairs were (i) a 40kV W/Ag (0.01cm) and a 70kV W/Cu (0.1cm) target/filter combinations, (ii) a 40kV W/Cd (0.013cm) and a 70kV W/Cu (0.1cm) target/filter combinations and (iii) a 40kV W/Pd (0.008cm) and a 70kV W/Cu (0.1cm) target/filter combinations. For each combination the Detective Quantum Efficiency (DQE), showing the signal to noise ratio transfer, the detector optical gain (DOG), showing the sensitivity of the detector and the coefficient of variation (CV) of the detector output signal were calculated. The second combination exhibited slightly higher DOG (326 photons per X-ray) and lower CV (0.755%) values. In terms of electron output from the RadEye CMOS, the first two combinations demonstrated comparable DQE values; however the second combination provided an increase of 6.5% in the electron output.

  14. High dynamic range CMOS-based mammography detector for FFDM and DBT

    NASA Astrophysics Data System (ADS)

    Peters, Inge M.; Smit, Chiel; Miller, James J.; Lomako, Andrey

    2016-03-01

    Digital Breast Tomosynthesis (DBT) requires excellent image quality in a dynamic mode at very low dose levels while Full Field Digital Mammography (FFDM) is a static imaging modality that requires high saturation dose levels. These opposing requirements can only be met by a dynamic detector with a high dynamic range. This paper will discuss a wafer-scale CMOS-based mammography detector with 49.5 μm pixels and a CsI scintillator. Excellent image quality is obtained for FFDM as well as DBT applications, comparing favorably with a-Se detectors that dominate the X-ray mammography market today. The typical dynamic range of a mammography detector is not high enough to accommodate both the low noise and the high saturation dose requirements for DBT and FFDM applications, respectively. An approach based on gain switching does not provide the signal-to-noise benefits in the low-dose DBT conditions. The solution to this is to add frame summing functionality to the detector. In one X-ray pulse several image frames will be acquired and summed. The requirements to implement this into a detector are low noise levels, high frame rates and low lag performance, all of which are unique characteristics of CMOS detectors. Results are presented to prove that excellent image quality is achieved, using a single detector for both DBT as well as FFDM dose conditions. This method of frame summing gave the opportunity to optimize the detector noise and saturation level for DBT applications, to achieve high DQE level at low dose, without compromising the FFDM performance.

  15. A CMOS frontend chip for implantable neural recording with wide voltage supply range

    NASA Astrophysics Data System (ADS)

    Jialin, Liu; Xu, Zhang; Xiaohui, Hu; Yatao, Guo; Peng, Li; Ming, Liu; Bin, Li; Hongda, Chen

    2015-10-01

    A design for a CMOS frontend integrated circuit (chip) for neural signal acquisition working at wide voltage supply range is presented in this paper. The chip consists of a preamplifier, a serial instrumental amplifier (IA) and a cyclic analog-to-digital converter (CADC). The capacitive-coupled and capacitive-feedback topology combined with MOS-bipolar pseudo-resistor element is adopted in the preamplifier to create a -3 dB upper cut-off frequency less than 1 Hz without using a ponderous discrete device. A dual-amplifier instrumental amplifier is used to provide a low output impedance interface for ADC as well as to boost the gain. The preamplifier and the serial instrumental amplifier together provide a midband gain of 45.8 dB and have an input-referred noise of 6.7 μVrms integrated from 1 Hz to 5 kHz. The ADC digitizes the amplified signal at 12-bits precision with a highest sampling rate of 130 kS/s. The measured effective number of bits (ENOB) of the ADC is 8.7 bits. The entire circuit draws 165 to 216 μA current from the supply voltage varied from 1.34 to 3.3 V. The prototype chip is fabricated in the 0.18-μm CMOS process and occupies an area of 1.23 mm2 (including pads). In-vitro recording was successfully carried out by the proposed frontend chip. Project supported by the National Natural Science Foundation of China (Nos. 61474107, 61372060, 61335010, 61275200, 61178051) and the Key Program of the Chinese Academy of Sciences (No. KJZD-EW-L11-01).

  16. Iterative current mode per pixel ADC for 3D SoftChip implementation in CMOS

    NASA Astrophysics Data System (ADS)

    Lachowicz, Stefan W.; Rassau, Alexander; Lee, Seung-Minh; Eshraghian, Kamran; Lee, Mike M.

    2003-04-01

    Mobile multimedia communication has rapidly become a significant area of research and development constantly challenging boundaries on a variety of technological fronts. The processing requirements for the capture, conversion, compression, decompression, enhancement, display, etc. of increasingly higher quality multimedia content places heavy demands even on current ULSI (ultra large scale integration) systems, particularly for mobile applications where area and power are primary considerations. The ADC presented in this paper is designed for a vertically integrated (3D) system comprising two distinct layers bonded together using Indium bump technology. The top layer is a CMOS imaging array containing analogue-to-digital converters, and a buffer memory. The bottom layer takes the form of a configurable array processor (CAP), a highly parallel array of soft programmable processors capable of carrying out complex processing tasks directly on data stored in the top plane. This paper presents a ADC scheme for the image capture plane. The analogue photocurrent or sampled voltage is transferred to the ADC via a column or a column/row bus. In the proposed system, an array of analogue-to-digital converters is distributed, so that a one-bit cell is associated with one sensor. The analogue-to-digital converters are algorithmic current-mode converters. Eight such cells are cascaded to form an 8-bit converter. Additionally, each photo-sensor is equipped with a current memory cell, and multiple conversions are performed with scaled values of the photocurrent for colour processing.

  17. Real-time fluorescence lifetime actuation for cell sorting using a CMOS SPAD silicon photomultiplier.

    PubMed

    Rocca, Francescopaolo Mattioli Della; Nedbal, Jakub; Tyndall, David; Krstajić, Nikola; Li, David Day-Uei; Ameer-Beg, Simon M; Henderson, Robert K

    2016-02-15

    Time-correlated single photon counting (TCSPC) is a fundamental fluorescence lifetime measurement technique offering high signal to noise ratio (SNR). However, its requirement for complex software algorithms for histogram processing restricts throughput in flow cytometers and prevents on-the-fly sorting of cells. We present a single-point digital silicon photomultiplier (SiPM) detector accomplishing real-time fluorescence lifetime-activated actuation targeting cell sorting applications in flow cytometry. The sensor also achieves burst-integrated fluorescence lifetime (BIFL) detection by TCSPC. The SiPM is a single-chip complementary metal-oxide-semiconductor (CMOS) sensor employing a 32×32 single-photon avalanche diode (SPAD) array and eight pairs of time-interleaved time to digital converters (TI-TDCs) with a 50 ps minimum timing resolution. The sensor's pile-up resistant embedded center of mass method (CMM) processor accomplishes low-latency measurement and thresholding of fluorescence lifetime. A digital control signal is generated with a 16.6 μs latency for cell sorter actuation allowing a maximum cell throughput of 60,000 cells per second and an error rate of 0.6%. PMID:26872160

  18. Highly-Integrated CMOS Interface Circuits for SiPM-Based PET Imaging Systems.

    PubMed

    Dey, Samrat; Lewellen, Thomas K; Miyaoka, Robert S; Rudell, Jacques C

    2012-01-01

    Recent developments in the area of Positron Emission Tomography (PET) detectors using Silicon Photomultipliers (SiPMs) have demonstrated the feasibility of higher resolution PET scanners due to a significant reduction in the detector form factor. The increased detector density requires a proportionally larger number of channels to interface the SiPM array with the backend digital signal processing necessary for eventual image reconstruction. This work presents a CMOS ASIC design for signal reducing readout electronics in support of an 8×8 silicon photomultiplier array. The row/column/diagonal summation circuit significantly reduces the number of required channels, reducing the cost of subsequent digitizing electronics. Current amplifiers are used with a single input from each SiPM cathode. This approach helps to reduce the detector loading, while generating all the necessary row, column and diagonal addressing information. In addition, the single current amplifier used in our Pulse-Positioning architecture facilitates the extraction of pulse timing information. Other components under design at present include a current-mode comparator which enables threshold detection for dark noise current reduction, a transimpedance amplifier and a variable output impedance I/O driver which adapts to a wide range of loading conditions between the ASIC and lines with the off-chip Analog-to-Digital Converters (ADCs). PMID:24301987

  19. An NFC-Enabled CMOS IC for a Wireless Fully Implantable Glucose Sensor.

    PubMed

    DeHennis, Andrew; Getzlaff, Stefan; Grice, David; Mailand, Marko

    2016-01-01

    This paper presents an integrated circuit (IC) that merges integrated optical and temperature transducers, optical interface circuitry, and a near-field communication (NFC)-enabled digital, wireless readout for a fully passive implantable sensor platform to measure glucose in people with diabetes. A flip-chip mounted LED and monolithically integrated photodiodes serve as the transduction front-end to enable fluorescence readout. A wide-range programmable transimpedance amplifier adapts the sensor signals to the input of an 11-bit analog-to-digital converter digitizing the measurements. Measurement readout is enabled by means of wireless backscatter modulation to a remote NFC reader. The system is able to resolve current levels of less than 10 pA with a single fluorescent measurement energy consumption of less than 1 μJ. The wireless IC is fabricated in a 0.6-μm-CMOS process and utilizes a 13.56-MHz-based ISO15693 for passive wireless readout through a NFC interface. The IC is utilized as the core interface to a fluorescent, glucose transducer to enable a fully implantable sensor-based continuous glucose monitoring system. PMID:26372659

  20. Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

    NASA Astrophysics Data System (ADS)

    Laitinen, Jyrki; Ailisto, Heikki J.

    1999-09-01

    In this research characteristics of standard commercial CCD and CMOS cameras are evaluated experimentally and compared. Special attention is paid to the operation of these devices in low light level condition, which is typical to many surveillance and consumer electronics applications. One emerging application utilizing inexpensive image sensors at variable illumination condition is the UMTS (Universal Mobile Telecommunications System), which will deliver wirelessly, for example, pictures, graphics and video from the year 2002. The determination of the system performance is based in this study on the imaging of a calibrated gray scale test chart at varying illumination condition. At each level of illumination the system response is characterized by a signal to random noise figure. The signal is calculated as the difference of the system response to the lightest and darkest areas of the gray scale. The random noise is measured as the standard deviation of the gray values in a difference of two successive images of the test pattern. The standard deviation is calculated from 10-bit digitized images for small group of pixels (36 X 36) corresponding to the different areas of the gray scale in the test pattern images. If the random noise is plot as a function of signal (encoded in digital numbers, DN) for small group of pixels, a Photon Transfer curve is obtained. This is one of the basic performance standards of CCD sensors. However, if camera systems with nonlinear response or AGC are evaluated, the variations of the system response at different signal levels should be included to the performance measure. In these cases the signal to noise curve is useful. The signal to random noise curves were determined for a CCD and a CMOS camera characterized by similar specifications. The comparison between two camera systems shows that considerable differences between the operation of these devices especially at low light level condition can exist. It was found that approximately

  1. Improved Space Object Observation Techniques Using CMOS Detectors

    NASA Astrophysics Data System (ADS)

    Schildknecht, T.; Hinze, A.; Schlatter, P.; Silha, J.; Peltonen, J.; Santti, T.; Flohrer, T.

    2013-08-01

    CMOS-sensors, or in general Active Pixel Sensors (APS), are rapidly replacing CCDs in the consumer camera market. Due to significant technological advances during the past years these devices start to compete with CCDs also for demanding scientific imaging applications, in particular in the astronomy community. CMOS detectors offer a series of inherent advantages compared to CCDs, due to the structure of their basic pixel cells, which each contain their own amplifier and readout electronics. The most prominent advantages for space object observations are the extremely fast and flexible readout capabilities, feasibility for electronic shuttering and precise epoch registration, and the potential to perform image processing operations on-chip and in real-time. Presently applied and proposed optical observation strategies for space debris surveys and space surveillance applications had to be analyzed. The major design drivers were identified and potential benefits from using available and future CMOS sensors were assessed. The major challenges and design drivers for ground-based and space-based optical observation strategies have been analyzed. CMOS detector characteristics were critically evaluated and compared with the established CCD technology, especially with respect to the above mentioned observations. Similarly, the desirable on-chip processing functionalities which would further enhance the object detection and image segmentation were identified. Finally, the characteristics of a particular CMOS sensor available at the Zimmerwald observatory were analyzed by performing laboratory test measurements.

  2. CMOS Cell Sensors for Point-of-Care Diagnostics

    PubMed Central

    Adiguzel, Yekbun; Kulah, Haluk

    2012-01-01

    The burden of health-care related services in a global era with continuously increasing population and inefficient dissipation of the resources requires effective solutions. From this perspective, point-of-care diagnostics is a demanded field in clinics. It is also necessary both for prompt diagnosis and for providing health services evenly throughout the population, including the rural districts. The requirements can only be fulfilled by technologies whose productivity has already been proven, such as complementary metal-oxide-semiconductors (CMOS). CMOS-based products can enable clinical tests in a fast, simple, safe, and reliable manner, with improved sensitivities. Portability due to diminished sensor dimensions and compactness of the test set-ups, along with low sample and power consumption, is another vital feature. CMOS-based sensors for cell studies have the potential to become essential counterparts of point-of-care diagnostics technologies. Hence, this review attempts to inform on the sensors fabricated with CMOS technology for point-of-care diagnostic studies, with a focus on CMOS image sensors and capacitance sensors for cell studies. PMID:23112587

  3. ESD protection design for advanced CMOS

    NASA Astrophysics Data System (ADS)

    Huang, Jin B.; Wang, Gewen

    2001-10-01

    ESD effects in integrated circuits have become a major concern as today's technologies shrink to sub-micron/deep- sub-micron dimensions. The thinner gate oxide and shallower junction depth used in the advanced technologies make them very vulnerable to ESD damages. The advanced techniques like silicidation and STI (shallow trench insulation) used for improving other device performances make ESD design even more challenging. For non-silicided technologies, a certain DCGS (drain contact to gate edge spacing) is needed to achieve ESD hardness for nMOS output drivers and nMOS protection transistors. The typical DCGS values are 4-5um and 2-3um for 0.5um and 0.25um CMOS, respectively. The silicidation reduces the ballast resistance provided by DCGS with at least a factor of 10. As a result, scaling of the ESD performance with device width is lost and even zero ESD performance is reported for standard silicided devices. The device level ESD design is focused in this paper, which includes GGNMOS (gate grounded NMOS) and GCNMOS (gate coupled NMOS). The device level ESD testing including TLP (transmission line pulse) is given. Several ESD issues caused by advanced technologies have been pointed out. The possible solutions have been developed and summarized including silicide blocking, process optimization, back-end ballasting, and new protection scheme, dummy gate/n-well resistor ballsting, etc. Some of them require process cost increase, and others provide novel, compact, and simple design but involving royalty/IP (intellectual property) issue. Circuit level ESD design and layout design considerations are covered. The top-level ESD protection strategies are also given.

  4. Adiabatic circuits: converter for static CMOS signals

    NASA Astrophysics Data System (ADS)

    Fischer, J.; Amirante, E.; Bargagli-Stoffi, A.; Schmitt-Landsiedel, D.

    2003-05-01

    Ultra low power applications can take great advantages from adiabatic circuitry. In this technique a multiphase system is used which consists ideally of trapezoidal voltage signals. The input signals to be processed will often come from a function block realized in static CMOS. The static rectangular signals must be converted for the oscillating multiphase system of the adiabatic circuitry. This work shows how to convert the input signals to the proposed pulse form which is synchronized to the appropriate supply voltage. By means of adder structures designed for a 0.13µm technology in a 4-phase system there will be demonstrated, which additional circuits are necessary for the conversion. It must be taken into account whether the data arrive in parallel or serial form. Parallel data are all in one phase and therefore it is advantageous to use an adder structure with a proper input stage, e.g. a Carry Lookahead Adder (CLA). With a serial input stage it is possible to read and to process four signals during one cycle due to the adiabatic 4-phase system. Therefore input signals with a frequency four times higher than the adiabatic clock frequency can be used. This reduces the disadvantage of the slow clock period typical for adiabatic circuits. By means of an 8 bit Ripple Carry Adder (8 bit RCA) the serial reading will be introduced. If the word width is larger than 4 bits the word can be divided in 4 bit words which are processed in parallel. This is the most efficient way to minimize the number of input lines and pads. At the same time a high throughput is achieved.

  5. Radiation tolerant back biased CMOS VLSI

    NASA Technical Reports Server (NTRS)

    Maki, Gary K. (Inventor); Gambles, Jody W. (Inventor); Hass, Kenneth J. (Inventor)

    2003-01-01

    A CMOS circuit formed in a semiconductor substrate having improved immunity to total ionizing dose radiation, improved immunity to radiation induced latch up, and improved immunity to a single event upset. The architecture of the present invention can be utilized with the n-well, p-well, or dual-well processes. For example, a preferred embodiment of the present invention is described relative to a p-well process wherein the p-well is formed in an n-type substrate. A network of NMOS transistors is formed in the p-well, and a network of PMOS transistors is formed in the n-type substrate. A contact is electrically coupled to the p-well region and is coupled to first means for independently controlling the voltage in the p-well region. Another contact is electrically coupled to the n-type substrate and is coupled to second means for independently controlling the voltage in the n-type substrate. By controlling the p-well voltage, the effective threshold voltages of the n-channel transistors both drawn and parasitic can be dynamically tuned. Likewise, by controlling the n-type substrate, the effective threshold voltages of the p-channel transistors both drawn and parasitic can also be dynamically tuned. Preferably, by optimizing the threshold voltages of the n-channel and p-channel transistors, the total ionizing dose radiation effect will be neutralized and lower supply voltages can be utilized for the circuit which would result in the circuit requiring less power.

  6. Design of CMOS logic gates for TID radiation

    NASA Technical Reports Server (NTRS)

    Attia, John Okyere; Sasabo, Maria L.

    1993-01-01

    The rise time, fall time and propagation delay of the logic gates were derived. The effects of total ionizing dose (TID) radiation on the fall and rise times of CMOS logic gates were obtained using C program calculations and PSPICE simulations. The variations of mobility and threshold voltage on MOSFET transistors when subjected to TID radiation were used to determine the dependence of switching times on TID. The results of this work indicate that by increasing the size of P-channel transistor with respect to the N-channel transistors of the CMOS gates, the propagation delay of CMOS logic gate can be made to decrease with, or be independent of an increase in TID radiation.

  7. VHF NEMS-CMOS piezoresistive resonators for advanced sensing applications

    NASA Astrophysics Data System (ADS)

    Arcamone, Julien; Dupré, Cécilia; Arndt, Grégory; Colinet, Eric; Hentz, Sébastien; Ollier, Eric; Duraffourg, Laurent

    2014-10-01

    This work reports on top-down nanoelectromechanical resonators, which are among the smallest resonators listed in the literature. To overcome the fact that their electromechanical transduction is intrinsically very challenging due to their very high frequency (100 MHz) and ultimate size (each resonator is a 1.2 μm long, 100 nm wide, 20 nm thick silicon beam with 100 nm long and 30 nm wide piezoresistive lateral nanowire gauges), they have been monolithically integrated with an advanced fully depleted SOI CMOS technology. By advantageously combining the unique benefits of nanomechanics and nanoelectronics, this hybrid NEMS-CMOS device paves the way for novel breakthrough applications, such as NEMS-based mass spectrometry or hybrid NEMS/CMOS logic, which cannot be fully implemented without this association.

  8. Operation and biasing for single device equivalent to CMOS

    DOEpatents

    Welch, James D.

    2001-01-01

    Disclosed are semiconductor devices including at least one junction which is rectifying whether the semiconductor is caused to be N or P-type, by the presence of field induced carriers. In particular, inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to conventional multiple device CMOS systems, which can be operated as modulators, are disclosed as are a non-latching SCR and an approach to blocking parasitic currents. Operation of the gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems under typical bias schemes is described, and simple demonstrative five mask fabrication procedures for the inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems are also presented.

  9. Fabrication of the planar angular rotator using the CMOS process

    NASA Astrophysics Data System (ADS)

    Dai, Ching-Liang; Chang, Chien-Liu; Chen, Hung-Lin; Chang, Pei-Zen

    2002-05-01

    In this investigation we propose a novel planar angular rotator fabricated by the conventional complementary metal-oxide semiconductor (CMOS) process. Following the 0.6 μm single poly triple metal (SPTM) CMOS process, the device is completed by a simple maskless, post-process etching step. The rotor of the planar angular rotator rotates around its geometric center with electrostatic actuation. The proposed design adopts an intelligent mechanism including the slider-crank system to permit simultaneous motion. The CMOS planar angular rotator could be driven with driving voltages of around 40 V. The design proposed here has a shorter response time and longer life, without problems of friction and wear, compared to the more common planar angular micromotor.

  10. CMOS Geiger photodiode array with integrated signal processing for imaging of 2D objects using quantum dots

    NASA Astrophysics Data System (ADS)

    Stapels, Christopher J.; Lawrence, William G.; Gurjar, Rajan S.; Johnson, Erik B.; Christian, James F.

    2008-08-01

    Geiger-mode photodiodes (GPD) act as binary photon detectors that convert analog light intensity into digital pulses. Fabrication of arrays of GPD in a CMOS environment simplifies the integration of signal-processing electronics to enhance the performance and provide a low-cost detector-on-a-chip platform. Such an instrument facilitates imaging applications with extremely low light and confined volumes. High sensitivity reading of small samples enables twodimensional imaging of DNA arrays and for tracking single molecules, and observing their dynamic behavior. In this work, we describe the performance of a prototype imaging detector of GPD pixels, with integrated active quenching for use in imaging of 2D objects using fluorescent labels. We demonstrate the integration of on-chip memory and a parallel readout interface for an array of CMOS GPD pixels as progress toward an all-digital detector on a chip. We also describe advances in pixel-level signal processing and solid-state photomultiplier developments.

  11. High performance Si nanowire field-effect-transistors based on a CMOS inverter with tunable threshold voltage.

    PubMed

    Van, Ngoc Huynh; Lee, Jae-Hyun; Sohn, Jung Inn; Cha, Seung Nam; Whang, Dongmok; Kim, Jong Min; Kang, Dae Joon

    2014-05-21

    We successfully fabricated nanowire-based complementary metal-oxide semiconductor (NWCMOS) inverter devices by utilizing n- and p-type Si nanowire field-effect-transistors (NWFETs) via a low-temperature fabrication processing technique. We demonstrate that NWCMOS inverter devices can be operated at less than 1 V, a significantly lower voltage than that of typical thin-film based complementary metal-oxide semiconductor (CMOS) inverter devices. This low-voltage operation was accomplished by controlling the threshold voltage of the n-type Si NWFETs through effective management of the nanowire (NW) doping concentration, while realizing high voltage gain (>10) and ultra-low static power dissipation (≤3 pW) for high-performance digital inverter devices. This result offers a viable means of fabricating high-performance, low-operation voltage, and high-density digital logic circuits using a low-temperature fabrication processing technique suitable for next-generation flexible electronics. PMID:24727896

  12. 77 FR 26787 - Certain CMOS Image Sensors and Products Containing Same; Notice of Receipt of Complaint...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-05-07

    ... COMMISSION Certain CMOS Image Sensors and Products Containing Same; Notice of Receipt of Complaint... complaint entitled Certain CMOS Image Sensors and Products Containing Same, DN 2895; the Commission is... importation of certain CMOS image sensors and products containing same. The complaint names as...

  13. Spectrometer with CMOS demodulation of fiber optic Bragg grating sensors

    NASA Astrophysics Data System (ADS)

    Christiansen, Martin Brokner

    A CMOS imager based spectrometer is developed to interrogate a network containing a large number of Bragg grating sensors. The spectrometer uses a Prism-Grating- Prism (PGP) to spectrally separate serially multiplexed Bragg reflections on a single fiber. As a result, each Bragg grating produces a discrete spot on the CMOS imager that shifts horizontally as the Bragg grating experiences changes in strain or temperature. The reflected wavelength of the spot can be determined by finding the center of the spot produced. The use of a randomly addressable CMOS imager enables a flexible sampling rate. Some fibers can be interrogated at a high sampling rate while others can be interrogated at a low sampling rate. However, the use of a CMOS imager leads to several unique problems in terms of signal processing. These include a logarithmic pixel response, a low signal-to-noise ratio, a long pixel time constant, and software issues. The expected capabilities of the CMOS imager based spectrometer are determined with a theoretical model. The theoretical model tests three algorithms for determining the center of the spot: single row centroid, single row parabolic fit, and entire spot centroid. The theoretical results are compared to laboratory test data and field test data. The CMOS based spectrometer is capable of interrogating many optical fibers, and in the configuration tested, the fiber bundle consisted of 23 fibers. Using this system, a single fiber can be interrogated from 778 nm to 852 nm at 2100 Hz or multiple fibers can be interrogated over the same wavelength so that the total number of fiber interrogations is up to 2100 per second. The reflected Bragg wavelength can be determined within +/-3pm, corresponding to a +/-3μɛ uncertainty.

  14. Rolling Shutter Effect aberration compensation in Digital Holographic Microscopy

    NASA Astrophysics Data System (ADS)

    Monaldi, Andrea C.; Romero, Gladis G.; Cabrera, Carlos M.; Blanc, Adriana V.; Alanís, Elvio E.

    2016-05-01

    Due to the sequential-readout nature of most CMOS sensors, each row of the sensor array is exposed at a different time, resulting in the so-called rolling shutter effect that induces geometric distortion to the image if the video camera or the object moves during image acquisition. Particularly in digital holograms recording, while the sensor captures progressively each row of the hologram, interferometric fringes can oscillate due to external vibrations and/or noises even when the object under study remains motionless. The sensor records each hologram row in different instants of these disturbances. As a final effect, phase information is corrupted, distorting the reconstructed holograms quality. We present a fast and simple method for compensating this effect based on image processing tools. The method is exemplified by holograms of microscopic biological static objects. Results encourage incorporating CMOS sensors over CCD in Digital Holographic Microscopy due to a better resolution and less expensive benefits.

  15. A 65 nm CMOS LNA for Bolometer Application

    NASA Astrophysics Data System (ADS)

    Huang, Tom Nan; Boon, Chirn Chye; Zhu, Forest Xi; Yi, Xiang; He, Xiaofeng; Feng, Guangyin; Lim, Wei Meng; Liu, Bei

    2016-04-01

    Modern bolometers generally consist of large-scale arrays of detectors. Implemented in conventional technologies, such bolometer arrays suffer from integrability and productivity issues. Recently, the development of CMOS technologies has presented an opportunity for the massive production of high-performance and highly integrated bolometers. This paper presents a 65-nm CMOS LNA designed for a millimeter-wave bolometer's pre-amplification stage. By properly applying some positive feedback, the noise figure of the proposed LNA is minimized at under 6 dB and the bandwidth is extended to 30 GHz.

  16. Impact of technology trends on SEU in CMOS SRAMs

    SciTech Connect

    Dodd, P.E.; Sexton, F.W.; Hash, G.L.; Shaneyfelt, M.R.; Draper, B.L.; Farino, A.J.; Flores, R.S.

    1996-12-01

    The impact of technology trends on the SEU hardness of epitaxial CMOS SRAMs is investigated using three-dimensional simulation. The authors study trends in SEU susceptibility with parameter variations across and within technology generations. Upset mechanisms for various strike locations and their dependence on gate-length scaling are explored. Such studies are useful for technology development and providing input for process and design decisions. An application of SEU simulation to the development of a 0.5-{micro}m radiation-hardened CMOS SRAM is presented.

  17. Monolithic 3D CMOS Using Layered Semiconductors.

    PubMed

    Sachid, Angada B; Tosun, Mahmut; Desai, Sujay B; Hsu, Ching-Yi; Lien, Der-Hsien; Madhvapathy, Surabhi R; Chen, Yu-Ze; Hettick, Mark; Kang, Jeong Seuk; Zeng, Yuping; He, Jr-Hau; Chang, Edward Yi; Chueh, Yu-Lun; Javey, Ali; Hu, Chenming

    2016-04-01

    Monolithic 3D integrated circuits using transition metal dichalcogenide materials and low-temperature processing are reported. A variety of digital and analog circuits are implemented on two sequentially integrated layers of devices. Inverter circuit operation at an ultralow supply voltage of 150 mV is achieved, paving the way to high-density, ultralow-voltage, and ultralow-power applications. PMID:26833783

  18. Digital Citizenship

    ERIC Educational Resources Information Center

    Isman, Aytekin; Canan Gungoren, Ozlem

    2014-01-01

    Era in which we live is known and referred as digital age.In this age technology is rapidly changed and developed. In light of these technological advances in 21st century, schools have the responsibility of training "digital citizen" as well as a good citizen. Digital citizens must have extensive skills, knowledge, Internet and …

  19. Calibration of digital SLR Nikon D3X for the use in digital photogrammetry projects

    NASA Astrophysics Data System (ADS)

    Kraszewski, B.

    2012-06-01

    Results of research on calibration of high-resolution digital camera Nikon D3X have been presented. CMOS matrix stability in recording process of digital images, calculation of principle distance as well as principal point, radial distortion and tangential distortion were determined. The interior orientation parameters determined during calibration in test project were examined. All test images were obtained using three replaceable Nikkor lens of 24, 35 and 50 mm focal length. The calibration process was executed in Camera Calibration and Field Calibration modules of PhotoModeler software using convergent terrestrial images. It was also executed for single photo in DLT module of AeroSys software. For the determination of interior orientation parameters of digital camera for each lens the 2D and 3D test fields were used. Stability and repeatability of recorded digital images on CMOS matrix were examined on 25 control points which were evenly distributed on a white calibration table. Accuracy of pixel position on the image for 24 mm, 35 mm and 50 mm focal length was 0.06, 0.08 and 0.04 of image pixel, respectively. It was found that interior orientation parameters calculated using the PhotoModeler software for both calibration methods were correctly determined while when using the Aerosys software they were determined with lower accuracy. The very high accuracy of elaboration of a test photogrammetric project for each camera lens was obtained using interior orientation parameters calculated on the basis of convergent images and 3D field.

  20. Performance optimization of digital VLSI circuits

    SciTech Connect

    Marple, D.P.

    1987-01-01

    Designers of digital VLSI circuits have virtually no computer tools available for the optimization of circuit performance. Instead, a designer relies extensively on circuit-analysis tools, such as circuit simulation (SPICE) and/or critical-delay-path analysis. A circuit-analysis approach to digital design is very labor-intensive and seldom produces a circuit with optimum area/delay or power/delay trade off. The goal of this research is to provide a synthesis approach to the design of digital circuits by finding the sizes of transistors that optimize circuits by finding the sizes of transistors that optimize circuit performance (delay, area, power). Solutions are found that are optimum for all possible delay paths of a given circuit and not for just a single path. The approach of this research is to formulate the problem of area/delay or power/delay optimization as a nonlinear program. Conditions for optimality are then established using graph theory and Kuhn-Tucker conditions. Finally, the use of augmented-Lagrangian and projected-Lagrangian algorithms are reviewed for the solution of the nonlinear programs. Two computer programs, PLATO and COP, were developed by the author to optimize CMOS PLA's (PLATO) and general CMOS circuits (COP). These tools provably find the globally optimum transistor sizes for a given circuit. Results are presented for PLA's and small- to medium-sized cells.

  1. Process simulation in digital camera system

    NASA Astrophysics Data System (ADS)

    Toadere, Florin

    2012-06-01

    The goal of this paper is to simulate the functionality of a digital camera system. The simulations cover the conversion from light to numerical signal and the color processing and rendering. We consider the image acquisition system to be linear shift invariant and axial. The light propagation is orthogonal to the system. We use a spectral image processing algorithm in order to simulate the radiometric properties of a digital camera. In the algorithm we take into consideration the transmittances of the: light source, lenses, filters and the quantum efficiency of a CMOS (complementary metal oxide semiconductor) sensor. The optical part is characterized by a multiple convolution between the different points spread functions of the optical components. We use a Cooke triplet, the aperture, the light fall off and the optical part of the CMOS sensor. The electrical part consists of the: Bayer sampling, interpolation, signal to noise ratio, dynamic range, analog to digital conversion and JPG compression. We reconstruct the noisy blurred image by blending different light exposed images in order to reduce the photon shot noise, also we filter the fixed pattern noise and we sharpen the image. Then we have the color processing blocks: white balancing, color correction, gamma correction, and conversion from XYZ color space to RGB color space. For the reproduction of color we use an OLED (organic light emitting diode) monitor. The analysis can be useful to assist students and engineers in image quality evaluation and imaging system design. Many other configurations of blocks can be used in our analysis.

  2. Comparative study of a wireless digital system and 2 PSP digital systems on proximal caries detection and pixel values.

    PubMed

    dos Anjos Pontual, Andrea; de Melo, Daniela Pita; Pontual, Maria Luiza dos Anjos; de Almeida, Solange Maria; Haiter-Neto, Francisco

    2013-01-01

    This study compared the radiographic image quality of 2 photostimulable phosphor (PSP) plate systems with a radiographic system against a complementary metal oxide silicon (CMOS) system. Using the 3 digital systems, 160 approximal surfaces were radiographed under standardized conditions. Using a 5-point scale, 6 observers scored the resulting images for the presence of caries. The presence of caries was validated histologically, and the image receptors were evaluated using receiver operating characteristic curve analysis. The digital systems were used to take radiographs of an aluminum step wedge for objective analysis with pixel density measurements. The mean pixel values were analyzed statistically using the Kruskal-Wallis test and Dunn multiple comparison test (P < 0.01). The performance of the new CMOS system was comparable to the PSP plate systems and radiographic film. PMID:24064165

  3. A powerful ethernet interface module for digital camera control

    NASA Astrophysics Data System (ADS)

    Amato, Stephen M.; Geary, John C.

    2012-09-01

    We have found a commercially-available ethernet interface module with sufficient on-board resources to largely handle all timing generation tasks required by digital imaging systems found in astronomy. In addition to providing a high-bandwidth ethernet interface to the controller, it can largely replace the need for special-purpose timing circuitry. Examples for use with both CCD and CMOS imagers are provided.

  4. Digital Natives or Digital Tribes?

    ERIC Educational Resources Information Center

    Watson, Ian Robert

    2013-01-01

    This research builds upon the discourse surrounding digital natives. A literature review into the digital native phenomena was undertaken and found that researchers are beginning to identify the digital native as not one cohesive group but of individuals influenced by other factors. Primary research by means of questionnaire survey of technologies…

  5. Evaluation of MOBILE-based gate-level pipelining augmenting CMOS with RTDs

    NASA Astrophysics Data System (ADS)

    Nuñez, Juan; Avedillo, María J.; Quintana, José M.

    2011-05-01

    The incorporation of Resonant Tunnel Diodes (RTDs) into III/V transistor technologies has shown an improved circuit performance: higher circuit speed, reduced component count, and/or lowered power consumption. Currently, the incorporation of these devices into CMOS technologies (RTD-CMOS) is an area of active research. Although some works have focused the evaluation of the advantages of this incorporation, additional work in this direction is required. We compare RTD-CMOS and pure CMOS realizations of a network of logic gates which can be operated in a gate-level pipeline. Significant lower average power is obtained for RTD-CMOS implementations.

  6. A 128 x 128 CMOS Active Pixel Image Sensor for Highly Integrated Imaging Systems

    NASA Technical Reports Server (NTRS)

    Mendis, Sunetra K.; Kemeny, Sabrina E.; Fossum, Eric R.

    1993-01-01

    A new CMOS-based image sensor that is intrinsically compatible with on-chip CMOS circuitry is reported. The new CMOS active pixel image sensor achieves low noise, high sensitivity, X-Y addressability, and has simple timing requirements. The image sensor was fabricated using a 2 micrometer p-well CMOS process, and consists of a 128 x 128 array of 40 micrometer x 40 micrometer pixels. The CMOS image sensor technology enables highly integrated smart image sensors, and makes the design, incorporation and fabrication of such sensors widely accessible to the integrated circuit community.

  7. Low-Power Radio-Frequency SiGe Analog-to-Digital Converter

    NASA Technical Reports Server (NTRS)

    Thompson, Willie L, II; Hall, Wesley G.; Piepmeier, Jeffrey R.; Johnson-Bey, Charles T.

    2003-01-01

    A low-power, radio-frequency analog-to-digital converter (RF-ADC) for soil moisture remote sensing was designed and fabricated. The RF-ADC is the fundamental component used in a direct-sampling digital radiometer, which is proposed to minimize the power dissipation and system complexity for synthetic thinned array radiometer. The circuit was implemented using 0.8 micron 35-GHz silicon germanium BiCMOS technology. The total power dissipation was 222 mW.

  8. Mechanically Flexible and High-Performance CMOS Logic Circuits.

    PubMed

    Honda, Wataru; Arie, Takayuki; Akita, Seiji; Takei, Kuniharu

    2015-01-01

    Low-power flexible logic circuits are key components required by the next generation of flexible electronic devices. For stable device operation, such components require a high degree of mechanical flexibility and reliability. Here, the mechanical properties of low-power flexible complementary metal-oxide-semiconductor (CMOS) logic circuits including inverter, NAND, and NOR are investigated. To fabricate CMOS circuits on flexible polyimide substrates, carbon nanotube (CNT) network films are used for p-type transistors, whereas amorphous InGaZnO films are used for the n-type transistors. The power consumption and voltage gain of CMOS inverters are <500 pW/mm at Vin = 0 V (<7.5 nW/mm at Vin = 5 V) and >45, respectively. Importantly, bending of the substrate is not found to cause significant changes in the device characteristics. This is also observed to be the case for more complex flexible NAND and NOR logic circuits for bending states with a curvature radius of 2.6 mm. The mechanical stability of these CMOS logic circuits makes them ideal candidates for use in flexible integrated devices. PMID:26459882

  9. Effects Of Dose Rates On Radiation Damage In CMOS Parts

    NASA Technical Reports Server (NTRS)

    Goben, Charles A.; Coss, James R.; Price, William E.

    1990-01-01

    Report describes measurements of effects of ionizing-radiation dose rate on consequent damage to complementary metal oxide/semiconductor (CMOS) electronic devices. Depending on irradiation time and degree of annealing, survivability of devices in outer space, or after explosion of nuclear weapons, enhanced. Annealing involving recovery beyond pre-irradiation conditions (rebound) detrimental. Damage more severe at lower dose rates.

  10. Fabrication and characterization of CMOS-MEMS thermoelectric micro generators.

    PubMed

    Kao, Pin-Hsu; Shih, Po-Jen; Dai, Ching-Liang; Liu, Mao-Chen

    2010-01-01

    This work presents a thermoelectric micro generator fabricated by the commercial 0.35 μm complementary metal oxide semiconductor (CMOS) process and the post-CMOS process. The micro generator is composed of 24 thermocouples in series. Each thermocouple is constructed by p-type and n-type polysilicon strips. The output power of the generator depends on the temperature difference between the hot and cold parts in the thermocouples. In order to prevent heat-receiving in the cold part in the thermocouples, the cold part is covered with a silicon dioxide layer with low thermal conductivity to insulate the heat source. The hot part of the thermocouples is suspended and connected to an aluminum plate, to increases the heat-receiving area in the hot part. The generator requires a post-CMOS process to release the suspended structures. The post-CMOS process uses an anisotropic dry etching to remove the oxide sacrificial layer and an isotropic dry etching to etch the silicon substrate. Experimental results show that the micro generator has an output voltage of 67 μV at the temperature difference of 1 K. PMID:22205869

  11. Upper-Bound Estimates Of SEU in CMOS

    NASA Technical Reports Server (NTRS)

    Edmonds, Larry D.

    1990-01-01

    Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method.

  12. An SEU-hardened CMOS data latch design

    SciTech Connect

    Rockett, L.R. Jr.

    1988-12-01

    A Single Event Upset (SEU)-hardened Complementary Metal-Oxide Semiconductor (CMOS) data latch design is described. The hardness is achieved by virtue of the latch design, thus no fabrication process or design groundrule development is required. Hardness is gained with comparatively little adverse impact on performance. Cyclotron tests provided hardness verification.

  13. CMOS VLSI Layout and Verification of a SIMD Computer

    NASA Technical Reports Server (NTRS)

    Zheng, Jianqing

    1996-01-01

    A CMOS VLSI layout and verification of a 3 x 3 processor parallel computer has been completed. The layout was done using the MAGIC tool and the verification using HSPICE. Suggestions for expanding the computer into a million processor network are presented. Many problems that might be encountered when implementing a massively parallel computer are discussed.

  14. Attributes and drawbacks of submicron CMOS for IR FPA readouts

    NASA Astrophysics Data System (ADS)

    Kozlowski, L. J.

    1998-09-01

    The availability of submicron CMOS has enabled the development of shingle-chip IR cameras having performance capabilities and on-chip functions which were previously impossible. Sensor designers are, however, encoutering and overcoming several challanges including steadily decreasing operating voltage.

  15. Relationship between IBICC imaging and SEU in CMOS ICs

    SciTech Connect

    Sexton, F.W.; Horn, K.M.; Doyle, B.L.; Laird, J.S.; Cholewa, M.; Saint, A.; Legge, G.J.F.

    1993-03-01

    Ion-beam-induced charge-collection (IBICC) images of the TA670 16K-bit CMOS SRAM are analyzed and compared to previous SEU images. Enhanced charge collection was observed in the n-source/drains regions consistent with bipolar amplification or shunting.

  16. Relationship between IBICC imaging and SEU in CMOS ICs

    SciTech Connect

    Sexton, F.W.; Horn, K.M.; Doyle, B.L. ); Laird, J.S.; Cholewa, M.; Saint, A.; Legge, G.J.F. )

    1993-01-01

    Ion-beam-induced charge-collection (IBICC) images of the TA670 16K-bit CMOS SRAM are analyzed and compared to previous SEU images. Enhanced charge collection was observed in the n-source/drains regions consistent with bipolar amplification or shunting.

  17. Overcoming scaling concerns in a radiation-hardening CMOS technology

    SciTech Connect

    Maimon, J.; Haddad, N.

    1999-12-01

    Scaling efforts to develop an advanced radiation-hardened CMOS process to support a 4M SRAM are described. Issues encountered during scaling of transistor, isolation, and resistor elements are discussed, as well as the solutions used to overcome these issues. Transistor data, total dose radiation results, and the performance of novel resistors for prevention of single event upsets (SEU) are presented.

  18. Reliability design of CMOS image sensor for space applications

    NASA Astrophysics Data System (ADS)

    Xie, Ning; Chen, Shijun; Chen, Yongping

    2013-08-01

    In space applications, sensors work in very harsh space environment. Thus the reliability design must be carefully considered. This paper addresses the techniques which effectively increase the reliability of CMOS image sensors. A radiation tolerant pixel design which is implemented in a sun tracker sensor is presented. Measurement results of total dose radiation, SEL, SEU, etc prove the radiation immunity of the sensor.

  19. Fabrication and Characterization of CMOS-MEMS Thermoelectric Micro Generators

    PubMed Central

    Kao, Pin-Hsu; Shih, Po-Jen; Dai, Ching-Liang; Liu, Mao-Chen

    2010-01-01

    This work presents a thermoelectric micro generator fabricated by the commercial 0.35 μm complementary metal oxide semiconductor (CMOS) process and the post-CMOS process. The micro generator is composed of 24 thermocouples in series. Each thermocouple is constructed by p-type and n-type polysilicon strips. The output power of the generator depends on the temperature difference between the hot and cold parts in the thermocouples. In order to prevent heat-receiving in the cold part in the thermocouples, the cold part is covered with a silicon dioxide layer with low thermal conductivity to insulate the heat source. The hot part of the thermocouples is suspended and connected to an aluminum plate, to increases the heat-receiving area in the hot part. The generator requires a post-CMOS process to release the suspended structures. The post-CMOS process uses an anisotropic dry etching to remove the oxide sacrificial layer and an isotropic dry etching to etch the silicon substrate. Experimental results show that the micro generator has an output voltage of 67 μV at the temperature difference of 1 K. PMID:22205869

  20. Thin Film on CMOS Active Pixel Sensor for Space Applications

    PubMed Central

    Schulze Spuentrup, Jan Dirk; Burghartz, Joachim N.; Graf, Heinz-Gerd; Harendt, Christine; Hutter, Franz; Nicke, Markus; Schmidt, Uwe; Schubert, Markus; Sterzel, Juergen

    2008-01-01

    A 664 × 664 element Active Pixel image Sensor (APS) with integrated analog signal processing, full frame synchronous shutter and random access for applications in star sensors is presented and discussed. A thick vertical diode array in Thin Film on CMOS (TFC) technology is explored to achieve radiation hardness and maximum fill factor.

  1. CMOS Ultra Low Power Radiation Tolerant (CULPRiT) Microelectronics

    NASA Technical Reports Server (NTRS)

    Yeh, Penshu; Maki, Gary

    2007-01-01

    Space Electronics needs Radiation Tolerance or hardness to withstand the harsh space environment: high-energy particles can change the state of the electronics or puncture transistors making them disfunctional. This viewgraph document reviews the use of CMOS Ultra Low Power Radiation Tolerant circuits for NASA's electronic requirements.

  2. CCD AND PIN-CMOS DEVELOPMENTS FOR LARGE OPTICAL TELESCOPE.

    SciTech Connect

    RADEKA, V.

    2006-04-03

    Higher quantum efficiency in near-IR, narrower point spread function and higher readout speed than with conventional sensors have been receiving increased emphasis in the development of CCDs and silicon PIN-CMOS sensors for use in large optical telescopes. Some key aspects in the development of such devices are reviewed.

  3. Mechanically Flexible and High-Performance CMOS Logic Circuits

    PubMed Central

    Honda, Wataru; Arie, Takayuki; Akita, Seiji; Takei, Kuniharu

    2015-01-01

    Low-power flexible logic circuits are key components required by the next generation of flexible electronic devices. For stable device operation, such components require a high degree of mechanical flexibility and reliability. Here, the mechanical properties of low-power flexible complementary metal–oxide–semiconductor (CMOS) logic circuits including inverter, NAND, and NOR are investigated. To fabricate CMOS circuits on flexible polyimide substrates, carbon nanotube (CNT) network films are used for p-type transistors, whereas amorphous InGaZnO films are used for the n-type transistors. The power consumption and voltage gain of CMOS inverters are <500 pW/mm at Vin = 0 V (<7.5 nW/mm at Vin = 5 V) and >45, respectively. Importantly, bending of the substrate is not found to cause significant changes in the device characteristics. This is also observed to be the case for more complex flexible NAND and NOR logic circuits for bending states with a curvature radius of 2.6 mm. The mechanical stability of these CMOS logic circuits makes them ideal candidates for use in flexible integrated devices. PMID:26459882

  4. Neutron induced soft errors in CMOS memories under reduced bias

    SciTech Connect

    Hazucha, P.; Svensson, C.; Johansson, K.

    1998-12-01

    A custom designed 16 kbit CMOS memory was irradiated by 14 MeV neutrons and 100 MeV neutrons. SEU cross sections were evaluated under different supply voltages. The cross section values are compared to those predicted by the BGR model.

  5. Planar CMOS analog SiPMs: design, modeling, and characterization

    NASA Astrophysics Data System (ADS)

    Zou, Yu; Villa, Federica; Bronzi, Danilo; Tisa, Simone; Tosi, Alberto; Zappa, Franco

    2015-11-01

    Silicon photomultipliers (SiPMs) are large area detectors consisting of an array of single-photon-sensitive microcells, which make SiPMs extremely attractive to substitute the photomultiplier tubes in many applications. We present the design, fabrication, and characterization of analog SiPMs in standard planar 0.35 μm CMOS technology, with about 1 mm × 1 mm total area and different kinds of microcells, based on single-photon avalanche diodes with 30 μm diameter reaching 21.0% fill-factor (FF), 50 μm diameter (FF = 58.3%) or 50 μm square active area with rounded corner of 5 μm radius (FF = 73.7%). We also developed the electrical SPICE model for CMOS SiPMs. Our CMOS SiPMs have 25 V breakdown voltage, in line with most commercial SiPMs and higher gain (8.8 × 106, 13.2 × 106, and 15.0 × 106, respectively). Although dark count rate density is slightly higher than state-of-the-art analog SiPMs, the proposed standard CMOS processing opens the feasibility of integration with active electronics, for switching hot pixels off, drastically reducing the overall dark count rate, or for further on-chip processing.

  6. CMOS Active-Pixel Image Sensor With Simple Floating Gates

    NASA Technical Reports Server (NTRS)

    Fossum, Eric R.; Nakamura, Junichi; Kemeny, Sabrina E.

    1996-01-01

    Experimental complementary metal-oxide/semiconductor (CMOS) active-pixel image sensor integrated circuit features simple floating-gate structure, with metal-oxide/semiconductor field-effect transistor (MOSFET) as active circuit element in each pixel. Provides flexibility of readout modes, no kTC noise, and relatively simple structure suitable for high-density arrays. Features desirable for "smart sensor" applications.

  7. INDEP approach for leakage reduction in nanoscale CMOS circuits

    NASA Astrophysics Data System (ADS)

    Sharma, Vijay Kumar; Pattanaik, Manisha; Raj, Balwinder

    2015-02-01

    Complementary metal oxide semiconductor (CMOS) technology scaling for improving speed and functionality turns leakage power one of the major concerns for nanoscale circuits design. The minimization of leakage power is a rising challenge for the design of the existing and future nanoscale CMOS circuits. This paper presents a novel, input-dependent, transistor-level, low leakage and reliable INput DEPendent (INDEP) approach for nanoscale CMOS circuits. INDEP approach is based on Boolean logic calculations for the input signals of the extra inserted transistors within the logic circuit. The gate terminals of extra inserted transistors depend on the primary input combinations of the logic circuits. The appropriate selection of input gate voltages of INDEP transistors are reducing the leakage current efficiently along with rail to rail output voltage swing. The important characteristic of INDEP approach is that it works well in both active as well as standby modes of the circuits. This approach overcomes the limitations created by the prevalent current leakage reduction techniques. The simulation results indicate that INDEP approach mitigates 41.6% and 35% leakage power for 1-bit full adder and ISCAS-85 c17 benchmark circuit, respectively, at 32 nm bulk CMOS technology node.

  8. Direct readout of gaseous detectors with tiled CMOS circuits

    NASA Astrophysics Data System (ADS)

    Visschers, J. L.; Blanco Carballo, V.; Chefdeville, M.; Colas, P.; van der Graaf, H.; Schmitz, J.; Smits, S.; Timmermans, J.

    2007-03-01

    A coordinated design effort is underway, exploring the three-dimensional direct readout of gaseous detectors by an anode plate equipped with a tiled array of many CMOS pixel readout ASICs, having amplification grids integrated on their topsides and being contacted on their backside.

  9. Analysis of pixel circuits in CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Mei, Zou; Chen, Nan; Yao, Li-bin

    2015-04-01

    CMOS image sensors (CIS) have lower power consumption, lower cost and smaller size than CCD image sensors. However, generally CCDs have higher performance than CIS mainly due to lower noise. The pixel circuit used in CIS is the first part of the signal processing circuit and connected to photodiode directly, so its performance will greatly affect the CIS or even the whole imaging system. To achieve high performance, CMOS image sensors need advanced pixel circuits. There are many pixel circuits used in CIS, such as passive pixel sensor (PPS), 3T and 4T active pixel sensor (APS), capacitive transimpedance amplifier (CTIA), and passive pixel sensor (PPS). At first, the main performance parameters of each pixel structure including the noise, injection efficiency, sensitivity, power consumption, and stability of bias voltage are analyzed. Through the theoretical analysis of those pixel circuits, it is concluded that CTIA pixel circuit has good noise performance, high injection efficiency, stable photodiode bias, and high sensitivity with small integrator capacitor. Furthermore, the APS and CTIA pixel circuits are simulated in a standard 0.18-μm CMOS process and using a n-well/p-sub photodiode by SPICE and the simulation result confirms the theoretical analysis result. It shows the possibility that CMOS image sensors can be extended to a wide range of applications requiring high performance.

  10. Hybrid CMOS SiPIN detectors as astronomical imagers

    NASA Astrophysics Data System (ADS)

    Simms, Lance Michael

    Charge Coupled Devices (CCDs) have dominated optical and x-ray astronomy since their inception in 1969. Only recently, through improvements in design and fabrication methods, have imagers that use Complimentary Metal Oxide Semiconductor (CMOS) technology gained ground on CCDs in scientific imaging. We are now in the midst of an era where astronomers might begin to design optical telescope cameras that employ CMOS imagers. The first three chapters of this dissertation are primarily composed of introductory material. In them, we discuss the potential advantages that CMOS imagers offer over CCDs in astronomical applications. We compare the two technologies in terms of the standard metrics used to evaluate and compare scientific imagers: dark current, read noise, linearity, etc. We also discuss novel features of CMOS devices and the benefits they offer to astronomy. In particular, we focus on a specific kind of hybrid CMOS sensor that uses Silicon PIN photodiodes to detect optical light in order to overcome deficiencies of commercial CMOS sensors. The remaining four chapters focus on a specific type of hybrid CMOS Silicon PIN sensor: the Teledyne Hybrid Visible Silicon PIN Imager (HyViSI). In chapters four and five, results from testing HyViSI detectors in the laboratory and at the Kitt Peak 2.1m telescope are presented. We present our laboratory measurements of the standard detector metrics for a number of HyViSI devices, ranging from 1k×1k to 4k×4k format. We also include a description of the SIDECAR readout circuit that was used to control the detectors. We then show how they performed at the telescope in terms of photometry, astrometry, variability measurement, and telescope focusing and guiding. Lastly, in the final two chapters we present results on detector artifacts such as pixel crosstalk, electronic crosstalk, and image persistence. One form of pixel crosstalk that has not been discussed elsewhere in the literature, which we refer to as Interpixel Charge

  11. A Single-Chip CMOS Pulse Oximeter with On-Chip Lock-In Detection

    PubMed Central

    He, Diwei; Morgan, Stephen P.; Trachanis, Dimitrios; van Hese, Jan; Drogoudis, Dimitris; Fummi, Franco; Stefanni, Francesco; Guarnieri, Valerio; Hayes-Gill, Barrie R.

    2015-01-01

    Pulse oximetry is a noninvasive and continuous method for monitoring the blood oxygen saturation level. This paper presents the design and testing of a single-chip pulse oximeter fabricated in a 0.35 µm CMOS process. The chip includes photodiode, transimpedance amplifier, analogue band-pass filters, analogue-to-digital converters, digital signal processor and LED timing control. The experimentally measured AC and DC characteristics of individual circuits including the DC output voltage of the transimpedance amplifier, transimpedance gain of the transimpedance amplifier, and the central frequency and bandwidth of the analogue band-pass filters, show a good match (within 1%) with the circuit simulations. With modulated light source and integrated lock-in detection the sensor effectively suppresses the interference from ambient light and 1/f noise. In a breath hold and release experiment the single chip sensor demonstrates consistent and comparable performance to commercial pulse oximetry devices with a mean of 1.2% difference. The single-chip sensor enables a compact and robust design solution that offers a route towards wearable devices for health monitoring. PMID:26184225

  12. The research on binocular stereo video imaging and display system based on low-light CMOS

    NASA Astrophysics Data System (ADS)

    Xie, Ruobing; Li, Li; Jin, Weiqi; Guo, Hong

    2015-10-01

    It is prevalent for the low-light night-vision helmet to equip the binocular viewer with image intensifiers. Such equipment can not only acquire night vision ability, but also obtain the sense of stereo vision to achieve better perception and understanding of the visual field. However, since the image intensifier is for direct-observation, it is difficult to apply the modern image processing technology. As a result, developing digital video technology in night vision is of great significance. In this paper, we design a low-light night-vision helmet with digital imaging device. It consists of three parts: a set of two low-illumination CMOS cameras, a binocular OLED micro display and an image processing PCB. Stereopsis is achieved through the binocular OLED micro display. We choose Speed-Up Robust Feature (SURF) algorithm for image registration. Based on the image matching information and the cameras' calibration parameters, disparity can be calculated in real-time. We then elaborately derive the constraints of binocular stereo display. The sense of stereo vision can be obtained by dynamically adjusting the content of the binocular OLED micro display. There is sufficient space for function extensions in our system. The performance of this low-light night-vision helmet can be further enhanced in combination with The HDR technology and image fusion technology, etc.

  13. A Single-Chip CMOS Pulse Oximeter with On-Chip Lock-In Detection.

    PubMed

    He, Diwei; Morgan, Stephen P; Trachanis, Dimitrios; van Hese, Jan; Drogoudis, Dimitris; Fummi, Franco; Stefanni, Francesco; Guarnieri, Valerio; Hayes-Gill, Barrie R

    2015-01-01

    Pulse oximetry is a noninvasive and continuous method for monitoring the blood oxygen saturation level. This paper presents the design and testing of a single-chip pulse oximeter fabricated in a 0.35 µm CMOS process. The chip includes photodiode, transimpedance amplifier, analogue band-pass filters, analogue-to-digital converters, digital signal processor and LED timing control. The experimentally measured AC and DC characteristics of individual circuits including the DC output voltage of the transimpedance amplifier, transimpedance gain of the transimpedance amplifier, and the central frequency and bandwidth of the analogue band-pass filters, show a good match (within 1%) with the circuit simulations. With modulated light source and integrated lock-in detection the sensor effectively suppresses the interference from ambient light and 1/f noise. In a breath hold and release experiment the single chip sensor demonstrates consistent and comparable performance to commercial pulse oximetry devices with a mean of 1.2% difference. The single-chip sensor enables a compact and robust design solution that offers a route towards wearable devices for health monitoring. PMID:26184225

  14. Laser doppler blood flow imaging using a CMOS imaging sensor with on-chip signal processing.

    PubMed

    He, Diwei; Nguyen, Hoang C; Hayes-Gill, Barrie R; Zhu, Yiqun; Crowe, John A; Gill, Cally; Clough, Geraldine F; Morgan, Stephen P

    2013-01-01

    The first fully integrated 2D CMOS imaging sensor with on-chip signal processing for applications in laser Doppler blood flow (LDBF) imaging has been designed and tested. To obtain a space efficient design over 64 × 64 pixels means that standard processing electronics used off-chip cannot be implemented. Therefore the analog signal processing at each pixel is a tailored design for LDBF signals with balanced optimization for signal-to-noise ratio and silicon area. This custom made sensor offers key advantages over conventional sensors, viz. the analog signal processing at the pixel level carries out signal normalization; the AC amplification in combination with an anti-aliasing filter allows analog-to-digital conversion with a low number of bits; low resource implementation of the digital processor enables on-chip processing and the data bottleneck that exists between the detector and processing electronics has been overcome. The sensor demonstrates good agreement with simulation at each design stage. The measured optical performance of the sensor is demonstrated using modulated light signals and in vivo blood flow experiments. Images showing blood flow changes with arterial occlusion and an inflammatory response to a histamine skin-prick demonstrate that the sensor array is capable of detecting blood flow signals from tissue. PMID:24051525

  15. A low-power time-domain VCO-based ADC in 65 nm CMOS

    NASA Astrophysics Data System (ADS)

    Chenluan, Wang; Shengxi, Diao; Fujiang, Lin

    2014-10-01

    A low-power, high-FoM (figure of merit), time-domain VCO (voltage controlled oscillator)-based ADC (analog-to-digital converter) in 65 nm CMOS technology is proposed. An asynchronous sigma—delta modulator (ASDM) is used to convert the voltage input signal to a square wave time signal, where the information is contained in its pulse-width. A time-domain quantizer, which uses VCO to convert voltage to frequency, is adopted, while the XOR (exclusive-OR) gate circuits convert the frequency information to digital representatives. The ASDM does not need an external clock, so there is no quantization noise. At the same time, the ASDM applies a harmonic-distortion-cancellation technique to its transconductance stage, which increases the SNDR (signal to noise and distortion ratio) performance of the ASDM. Since the output of the ASDM is a two-level voltage signal, the VCO's V—F (voltage to frequency) conversion curve is always linear. The XOR phase quantizer has an inherent feature of first-order noise-shaping. It puts the ADC's low-frequency output noise to high-frequency which is further filtered out by a low-pass filter. The proposed ADC achieves an SNR/SNDR of 54. dB/54.3 dB in the 8 MHz bandwidth, while consuming 2.8 mW. The FoM of the proposed ADC is a 334 fJ/conv-step.

  16. Laser Doppler Blood Flow Imaging Using a CMOS Imaging Sensor with On-Chip Signal Processing

    PubMed Central

    He, Diwei; Nguyen, Hoang C.; Hayes-Gill, Barrie R.; Zhu, Yiqun; Crowe, John A.; Gill, Cally; Clough, Geraldine F.; Morgan, Stephen P.

    2013-01-01

    The first fully integrated 2D CMOS imaging sensor with on-chip signal processing for applications in laser Doppler blood flow (LDBF) imaging has been designed and tested. To obtain a space efficient design over 64 × 64 pixels means that standard processing electronics used off-chip cannot be implemented. Therefore the analog signal processing at each pixel is a tailored design for LDBF signals with balanced optimization for signal-to-noise ratio and silicon area. This custom made sensor offers key advantages over conventional sensors, viz. the analog signal processing at the pixel level carries out signal normalization; the AC amplification in combination with an anti-aliasing filter allows analog-to-digital conversion with a low number of bits; low resource implementation of the digital processor enables on-chip processing and the data bottleneck that exists between the detector and processing electronics has been overcome. The sensor demonstrates good agreement with simulation at each design stage. The measured optical performance of the sensor is demonstrated using modulated light signals and in vivo blood flow experiments. Images showing blood flow changes with arterial occlusion and an inflammatory response to a histamine skin-prick demonstrate that the sensor array is capable of detecting blood flow signals from tissue. PMID:24051525

  17. Nanophotonic filters for digital imaging

    NASA Astrophysics Data System (ADS)

    Walls, Kirsty

    There has been an increasing demand for low cost, portable CMOS image sensors because of increased integration, and new applications in the automotive, mobile communication and medical industries, amongst others. Colour reproduction remains imperfect in conventional digital image sensors, due to the limitations of the dye-based filters. Further improvement is required if the full potential of digital imaging is to be realised. In alternative systems, where accurate colour reproduction is a priority, existing equipment is too bulky for anything but specialist use. In this work both these issues are addressed by exploiting nanophotonic techniques to create enhanced trichromatic filters, and multispectral filters, all of which can be fabricated on-chip, i.e. integrated into a conventional digital image sensor, to create compact, low cost, mass produceable imaging systems with accurate colour reproduction. The trichromatic filters are based on plasmonic structures. They exploit the excitation of surface plasmon resonances in arrays of subwavelength holes in metal films to filter light. The currently-known analytical expressions are inadequate for optimising all relevant parameters of a plasmonic structure. In order to obtain arbitrary filter characteristics, an automated design procedure was developed that integrated a genetic algorithm and 3D finite-difference time-domain tool. The optimisation procedure's efficacy is demonstrated by designing a set of plasmonic filters that replicate the CIE (1931) colour matching functions, which themselves mimic the human eye's daytime colour response.

  18. Design of a 2.4-GHz CMOS monolithic fractional-N frequency synthesizer

    NASA Astrophysics Data System (ADS)

    Shu, Keliu

    The wireless communication technology and market have been growing rapidly since a decade ago. The high demand market is a driving need for higher integration in the wireless transceivers. The trend is to achieve low-cost, small form factor and low power consumption. With the ever-reducing feature size, it is becoming feasible to integrate the RF front-end together with the baseband in the low-cost CMOS technology. The frequency synthesizer is a key building block in the RF front-end of the transceivers. It is used as a local oscillator for frequency translation and channel selection. The design of a 2.4-GHz low-power frequency synthesizer in 0.35mum CMOS is a challenging task mainly due to the high-speed prescaler. In this dissertation, a brief review of conventional PLL and frequency synthesizers is provided. Design techniques of a 2.4-GHz monolithic SigmaDelta fractional-N frequency synthesizer are investigated. Novel techniques are proposed to tackle the speed and integration bottlenecks of high-frequency PLL. A low-power and inherently glitch-free phase-switching prescaler and an on-chip loop filter with capacitance multiplier are developed. Compared with the existing and popular dual-path topology, the proposed loop filter reduces circuit complexity and its power consumption and noise are negligible. Furthermore, a third-order three-level digital SigmaDelta modulator topology is employed to reduce the phase noise generated by the modulator. Suitable PFD and charge-pump designs are employed to reduce their nonlinearity effects and thus minimize the folding of the SigmaDelta modulator-shaped phase noise. A prototype of the fractional-N synthesizer together with some standalone building blocks is designed and fabricated in TSMC 0.35mum CMOS through MOSIS. The prototype frequency synthesizer and standalone prescaler and loop filter are characterized. The feasibility and practicality of the proposed prescaler and loop filter are experimentally verified.

  19. A Linearization Time-Domain CMOS Smart Temperature Sensor Using a Curvature Compensation Oscillator

    PubMed Central

    Chen, Chun-Chi; Chen, Hao-Wen

    2013-01-01

    This paper presents an area-efficient time-domain CMOS smart temperature sensor using a curvature compensation oscillator for linearity enhancement with a −40 to 120 °C temperature range operability. The inverter-based smart temperature sensors can substantially reduce the cost and circuit complexity of integrated temperature sensors. However, a large curvature exists on the temperature-to-time transfer curve of the inverter-based delay line and results in poor linearity of the sensor output. For cost reduction and error improvement, a temperature-to-pulse generator composed of a ring oscillator and a time amplifier was used to generate a thermal sensing pulse with a sufficient width proportional to the absolute temperature (PTAT). Then, a simple but effective on-chip curvature compensation oscillator is proposed to simultaneously count and compensate the PTAT pulse with curvature for linearization. With such a simple structure, the proposed sensor possesses an extremely small area of 0.07 mm2 in a TSMC 0.35-μm CMOS 2P4M digital process. By using an oscillator-based scheme design, the proposed sensor achieves a fine resolution of 0.045 °C without significantly increasing the circuit area. With the curvature compensation, the inaccuracy of −1.2 to 0.2 °C is achieved in an operation range of −40 to 120 °C after two-point calibration for 14 packaged chips. The power consumption is measured as 23 μW at a sample rate of 10 samples/s. PMID:23989825

  20. High-speed CMOS image sensor for high-throughput lensless microfluidic imaging system

    NASA Astrophysics Data System (ADS)

    Yan, Mei; Huang, Xiwei; Jia, Qixiang; Nadipalli, Revanth; Wang, Tongxi; Shang, Yang; Yu, Hao; Je, Minkyu; Yeo, Kiatseng

    2012-03-01

    The integration of CMOS image sensor and microfluidics becomes a promising technology for point-of-care (POC) diagnosis. However, commercial image sensors usually have limited speed and low-light sensitivity. One high-speed and high-sensitivity CMOS image sensor chip is introduced in this paper, targeted for high-throughput microfluidic imaging system. Firstly, high speed image sensor architecture is introduced with design of column-parallel single-slope analog-todigital converter (ADC) with digital correlated double sampling (CDS). The frame rate can be achieved to 2400 frames/second (fps) with resolution of 128×96 for high-throughput microfluidic imaging. Secondly, the designed system has superior low-light sensitivity, which is achieved by large pixel size (10μm×10μm, 56% fill factor). Pixel peak signalnoise- ratio (SNR) reaches to 50dB with 10dB improvement compared to the commercial pixel (2.2μm×2.2μm). The degradation of pixel resolution is compensated by super-resolution image processing algorithm. By reconstructing single image with multiple low-resolution frames, we can equivalently achieve 2μm resolution with physical 10μm pixel. Thirdly, the system-on-chip (SoC) integration results in a real-time controlled intelligent imaging system without expensive data storage and time-consuming computer analysis. This initial sensor prototype with timing-control makes it possible to develop high-throughput lensless microfluidic imaging system for POC diagnosis.

  1. Commercial CMOS image sensors as X-ray imagers and particle beam monitors

    NASA Astrophysics Data System (ADS)

    Castoldi, A.; Guazzoni, C.; Maffessanti, S.; Montemurro, G. V.; Carraresi, L.

    2015-01-01

    CMOS image sensors are widely used in several applications such as mobile handsets webcams and digital cameras among others. Furthermore they are available across a wide range of resolutions with excellent spectral and chromatic responses. In order to fulfill the need of cheap systems as beam monitors and high resolution image sensors for scientific applications we exploited the possibility of using commercial CMOS image sensors as X-rays and proton detectors. Two different sensors have been mounted and tested. An Aptina MT9v034, featuring 752 × 480 pixels, 6μm × 6μm pixel size has been mounted and successfully tested as bi-dimensional beam profile monitor, able to take pictures of the incoming proton bunches at the DeFEL beamline (1-6 MeV pulsed proton beam) of the LaBeC of INFN in Florence. The naked sensor is able to successfully detect the interactions of the single protons. The sensor point-spread-function (PSF) has been qualified with 1MeV protons and is equal to one pixel (6 mm) r.m.s. in both directions. A second sensor MT9M032, featuring 1472 × 1096 pixels, 2.2 × 2.2 μm pixel size has been mounted on a dedicated board as high-resolution imager to be used in X-ray imaging experiments with table-top generators. In order to ease and simplify the data transfer and the image acquisition the system is controlled by a dedicated micro-processor board (DM3730 1GHz SoC ARM Cortex-A8) on which a modified LINUX kernel has been implemented. The paper presents the architecture of the sensor systems and the results of the experimental measurements.

  2. High speed wide field CMOS camera for Transneptunian Automatic Occultation Survey

    NASA Astrophysics Data System (ADS)

    Wang, Shiang-Yu; Geary, John C.; Amato, Stephen M.; Hu, Yen-Sang; Ling, Hung-Hsu; Huang, Pin-Jie; Furesz, Gabor; Chen, Hsin-Yo; Chang, Yin-Chang; Szentgyorgyi, Andrew; Lehner, Matthew; Norton, Timothy

    2014-08-01

    The Transneptunian Automated Occultation Survey (TAOS II) is a three robotic telescope project to detect the stellar occultation events generated by Trans Neptunian Objects (TNOs). TAOS II project aims to monitor about 10000 stars simultaneously at 20Hz to enable statistically significant event rate. The TAOS II camera is designed to cover the 1.7 degree diameter field of view (FoV) of the 1.3m telescope with 10 mosaic 4.5kx2k CMOS sensors. The new CMOS sensor has a back illumination thinned structure and high sensitivity to provide similar performance to that of the backillumination thinned CCDs. The sensor provides two parallel and eight serial decoders so the region of interests can be addressed and read out separately through different output channels efficiently. The pixel scale is about 0.6"/pix with the 16μm pixels. The sensors, mounted on a single Invar plate, are cooled to the operation temperature of about 200K by a cryogenic cooler. The Invar plate is connected to the dewar body through a supporting ring with three G10 bipods. The deformation of the cold plate is less than 10μm to ensure the sensor surface is always within ±40μm of focus range. The control electronics consists of analog part and a Xilinx FPGA based digital circuit. For each field star, 8×8 pixels box will be readout. The pixel rate for each channel is about 1Mpix/s and the total pixel rate for each camera is about 80Mpix/s. The FPGA module will calculate the total flux and also the centroid coordinates for every field star in each exposure.

  3. A novel multi-actuation CMOS RF MEMS switch

    NASA Astrophysics Data System (ADS)

    Lee, Chiung-I.; Ko, Chih-Hsiang; Huang, Tsun-Che

    2008-12-01

    This paper demonstrates a capacitive shunt type RF MEMS switch, which is actuated by electro-thermal actuator and electrostatic actuator at the same time, and than latching the switching status by electrostatic force only. Since thermal actuators need relative low voltage compare to electrostatic actuators, and electrostatic force needs almost no power to maintain the switching status, the benefits of the mechanism are very low actuation voltage and low power consumption. Moreover, the RF MEMS switch has considered issues for integrated circuit compatible in design phase. So the switch is fabricated by a standard 0.35um 2P4M CMOS process and uses wet etching and dry etching technologies for postprocess. This compatible ability is important because the RF characteristics are not only related to the device itself. If a packaged RF switch and a packaged IC wired together, the parasitic capacitance will cause the problem for optimization. The structure of the switch consists of a set of CPW transmission lines and a suspended membrane. The CPW lines and the membrane are in metal layers of CMOS process. Besides, the electro-thermal actuators are designed by polysilicon layer of the CMOS process. So the RF switch is only CMOS process layers needed for both electro-thermal and electrostatic actuations in switch. The thermal actuator is composed of a three-dimensional membrane and two heaters. The membrane is a stacked step structure including two metal layers in CMOS process, and heat is generated by poly silicon resistors near the anchors of membrane. Measured results show that the actuation voltage of the switch is under 7V for electro-thermal added electrostatic actuation.

  4. Monolithic active pixel sensors (MAPS) in a VLSI CMOS technology

    NASA Astrophysics Data System (ADS)

    Turchetta, R.; French, M.; Manolopoulos, S.; Tyndel, M.; Allport, P.; Bates, R.; O'Shea, V.; Hall, G.; Raymond, M.

    2003-03-01

    Monolithic Active Pixel Sensors (MAPS) designed in a standard VLSI CMOS technology have recently been proposed as a compact pixel detector for the detection of high-energy charged particle in vertex/tracking applications. MAPS, also named CMOS sensors, are already extensively used in visible light applications. With respect to other competing imaging technologies, CMOS sensors have several potential advantages in terms of low cost, low power, lower noise at higher speed, random access of pixels which allows windowing of region of interest, ability to integrate several functions on the same chip. This brings altogether to the concept of 'camera-on-a-chip'. In this paper, we review the use of CMOS sensors for particle physics and we analyse their performances in term of the efficiency (fill factor), signal generation, noise, readout speed and sensor area. In most of high-energy physics applications, data reduction is needed in the sensor at an early stage of the data processing before transfer of the data to tape. Because of the large number of pixels, data reduction is needed on the sensor itself or just outside. This brings in stringent requirements on the temporal noise as well as to the sensor uniformity, expressed as a Fixed Pattern Noise (FPN). A pixel architecture with an additional transistor is proposed. This architecture, coupled to correlated double sampling of the signal will allow cancellation of the two dominant noise sources, namely the reset or kTC noise and the FPN. A prototype has been designed in a standard 0.25 μm CMOS technology. It has also a structure for electrical calibration of the sensor. The prototype is functional and detailed tests are under way.

  5. An RF Energy Harvester System Using UHF Micropower CMOS Rectifier Based on a Diode Connected CMOS Transistor

    PubMed Central

    Shokrani, Mohammad Reza; Hamidon, Mohd Nizar B.; Rokhani, Fakhrul Zaman; Shafie, Suhaidi Bin

    2014-01-01

    This paper presents a new type diode connected MOS transistor to improve CMOS conventional rectifier's performance in RF energy harvester systems for wireless sensor networks in which the circuits are designed in 0.18 μm TSMC CMOS technology. The proposed diode connected MOS transistor uses a new bulk connection which leads to reduction in the threshold voltage and leakage current; therefore, it contributes to increment of the rectifier's output voltage, output current, and efficiency when it is well important in the conventional CMOS rectifiers. The design technique for the rectifiers is explained and a matching network has been proposed to increase the sensitivity of the proposed rectifier. Five-stage rectifier with a matching network is proposed based on the optimization. The simulation results shows 18.2% improvement in the efficiency of the rectifier circuit and increase in sensitivity of RF energy harvester circuit. All circuits are designed in 0.18 μm TSMC CMOS technology. PMID:24782680

  6. An RF energy harvester system using UHF micropower CMOS rectifier based on a diode connected CMOS transistor.

    PubMed

    Shokrani, Mohammad Reza; Khoddam, Mojtaba; Hamidon, Mohd Nizar B; Kamsani, Noor Ain; Rokhani, Fakhrul Zaman; Shafie, Suhaidi Bin

    2014-01-01

    This paper presents a new type diode connected MOS transistor to improve CMOS conventional rectifier's performance in RF energy harvester systems for wireless sensor networks in which the circuits are designed in 0.18  μm TSMC CMOS technology. The proposed diode connected MOS transistor uses a new bulk connection which leads to reduction in the threshold voltage and leakage current; therefore, it contributes to increment of the rectifier's output voltage, output current, and efficiency when it is well important in the conventional CMOS rectifiers. The design technique for the rectifiers is explained and a matching network has been proposed to increase the sensitivity of the proposed rectifier. Five-stage rectifier with a matching network is proposed based on the optimization. The simulation results shows 18.2% improvement in the efficiency of the rectifier circuit and increase in sensitivity of RF energy harvester circuit. All circuits are designed in 0.18 μm TSMC CMOS technology. PMID:24782680

  7. Digital metamaterials

    NASA Astrophysics Data System (ADS)

    Della Giovampaola, Cristian; Engheta, Nader

    2014-12-01

    Balancing complexity and simplicity has played an important role in the development of many fields in science and engineering. One of the well-known and powerful examples of such balance can be found in Boolean algebra and its impact on the birth of digital electronics and the digital information age. The simplicity of using only two numbers, ‘0’ and ‘1’, in a binary system for describing an arbitrary quantity made the fields of digital electronics and digital signal processing powerful and ubiquitous. Here, inspired by the binary concept, we propose to develop the notion of digital metamaterials. Specifically, we investigate how one can synthesize an electromagnetic metamaterial with a desired permittivity, using as building blocks only two elemental materials, which we call ‘metamaterial bits’, with two distinct permittivity functions. We demonstrate, analytically and numerically, how proper spatial mixtures of such metamaterial bits lead to elemental ‘metamaterial bytes’ with effective material parameters that are different from the parameters of the metamaterial bits. We then apply this methodology to several design examples of optical elements, such as digital convex lenses, flat graded-index digital lenses, digital constructs for epsilon-near-zero (ENZ) supercoupling and digital hyperlenses, thus highlighting the power and simplicity of the methodology.

  8. Digital metamaterials.

    PubMed

    Della Giovampaola, Cristian; Engheta, Nader

    2014-12-01

    Balancing complexity and simplicity has played an important role in the development of many fields in science and engineering. One of the well-known and powerful examples of such balance can be found in Boolean algebra and its impact on the birth of digital electronics and the digital information age. The simplicity of using only two numbers, '0' and '1', in a binary system for describing an arbitrary quantity made the fields of digital electronics and digital signal processing powerful and ubiquitous. Here, inspired by the binary concept, we propose to develop the notion of digital metamaterials. Specifically, we investigate how one can synthesize an electromagnetic metamaterial with a desired permittivity, using as building blocks only two elemental materials, which we call 'metamaterial bits', with two distinct permittivity functions. We demonstrate, analytically and numerically, how proper spatial mixtures of such metamaterial bits lead to elemental 'metamaterial bytes' with effective material parameters that are different from the parameters of the metamaterial bits. We then apply this methodology to several design examples of optical elements, such as digital convex lenses, flat graded-index digital lenses, digital constructs for epsilon-near-zero (ENZ) supercoupling and digital hyperlenses, thus highlighting the power and simplicity of the methodology. PMID:25218061

  9. Low-cost uncooled infrared detector arrays in standard CMOS

    NASA Astrophysics Data System (ADS)

    Eminoglu, Selim; Tanrikulu, M. Y.; Akin, Tayfun

    2003-09-01

    This paper reports the development of a low-cost 128 x 128 uncooled infrared focal plane array (FPA) based on suspended and thermally isolated CMOS p+-active/n-well diodes. The FPA is fabricated using a standard 0.35 μm CMOS process followed by simple post-CMOS bulk micromachining that does not require any critical lithography or complicated deposition steps; and therefore, the cost of the uncooled FPA is almost equal to the cost of the CMOS chip. The post-CMOS fabrication steps include an RIE etching to reach the bulk silicon and an anisotropic silicon etching to obtain thermally isolated pixels. During the RIE etching, CMOS metal layers are used as masking layers, and therefore, narrow openings such as 2 μm can be defined between the support arms. This approach allows achieving small pixel size of 40 μm x 40 μm with a fill factor of 44%. The FPA is scanned at 30 fps by monolithically integrated multi-channel parallel readout circuitry which is composed of low-noise differential transconductance amplifiers, switched capacitor (SC) integrators, sample-and-hold circuits, and various other circuit blocks for reducing the effects of variations in detector voltage and operating temperature. The fabricated detector has a temperature coefficient of -2 mV/K, a thermal conductance value of 1.8 x 10-7 W/K, and a thermal time constant value of 36 msec, providing a measured DC responsivity (R) of 4970 V/W under continuous bias. Measured detector noise is 0.69 μV in 8 kHz bandwidth at 30 fps scanning rate, resulting a measured detectivity (D*) of 9.7 x 108 cm√HzW. Contribution of the 1/f noise component is found to be negligible due to the single crystal nature of the silicon n-well and its low value at low bias levels. The noise of the readout circuit is measured as 0.76 μV, resulting in an expected NETD value of 1 K when scanned at 30 fps using f=1 optics. This NETD value can be decreased below 350 mK by decreasing the electrical bandwidth with the help of increased

  10. A 0.18 micrometer CMOS Thermopile Readout ASIC Immune to 50 MRAD Total Ionizing Dose (SI) and Single Event Latchup to 174MeV-cm(exp 2)/mg

    NASA Technical Reports Server (NTRS)

    Quilligan, Gerard T.; Aslam, Shahid; Lakew, Brook; DuMonthier, Jeffery J.; Katz, Richard B.; Kleyner, Igor

    2014-01-01

    Radiation hardened by design (RHBD) techniques allow commercial CMOS circuits to operate in high total ionizing dose and particle fluence environments. Our radiation hard multi-channel digitizer (MCD) ASIC (Figure 1) is a versatile analog system on a chip (SoC) fabricated in 180nm CMOS. It provides 18 chopper stabilized amplifier channels, a 16- bit sigma-delta analog-digital converter (SDADC) and an on-chip controller. The MCD was evaluated at Goddard Space Flight Center and Texas A&M University's radiation effects facilities and found to be immune to single event latchup (SEL) and total ionizing dose (TID) at 174 MeV-cm(exp 2)/mg and 50 Mrad (Si) respectively.

  11. The design of the CMOS wireless bar code scanner applying optical system based on ZigBee

    NASA Astrophysics Data System (ADS)

    Chen, Yuelin; Peng, Jian

    2008-03-01

    The traditional bar code scanner is influenced by the length of data line, but the farthest distance of the wireless bar code scanner of wireless communication is generally between 30m and 100m on the market. By rebuilding the traditional CCD optical bar code scanner, a CMOS code scanner is designed based on the ZigBee to meet the demands of market. The scan system consists of the CMOS image sensor and embedded chip S3C2401X, when the two dimensional bar code is read, the results show the inaccurate and wrong code bar, resulted from image defile, disturber, reads image condition badness, signal interference, unstable system voltage. So we put forward the method which uses the matrix evaluation and Read-Solomon arithmetic to solve them. In order to construct the whole wireless optics of bar code system and to ensure its ability of transmitting bar code image signals digitally with long distances, ZigBee is used to transmit data to the base station, and this module is designed based on image acquisition system, and at last the wireless transmitting/receiving CC2430 module circuit linking chart is established. And by transplanting the embedded RTOS system LINUX to the MCU, an applying wireless CMOS optics bar code scanner and multi-task system is constructed. Finally, performance of communication is tested by evaluation software Smart RF. In broad space, every ZIGBEE node can realize 50m transmission with high reliability. When adding more ZigBee nodes, the transmission distance can be several thousands of meters long.

  12. Digital photography: a primer for pathologists.

    PubMed

    Riley, Roger S; Ben-Ezra, Jonathan M; Massey, Davis; Slyter, Rodney L; Romagnoli, Gina

    2004-01-01

    The computer and the digital camera provide a unique means for improving hematology education, research, and patient service. High quality photographic images of gross specimens can be rapidly and conveniently acquired with a high-resolution digital camera, and specialized digital cameras have been developed for photomicroscopy. Digital cameras utilize charge-coupled devices (CCD) or Complementary Metal Oxide Semiconductor (CMOS) image sensors to measure light energy and additional circuitry to convert the measured information into a digital signal. Since digital cameras do not utilize photographic film, images are immediately available for incorporation into web sites or digital publications, printing, transfer to other individuals by email, or other applications. Several excellent digital still cameras are now available for less than 2,500 dollars that capture high quality images comprised of more than 6 megapixels. These images are essentially indistinguishable from conventional film images when viewed on a quality color monitor or printed on a quality color or black and white printer at sizes up to 11x14 inches. Several recent dedicated digital photomicroscopy cameras provide an ultrahigh quality image output of more than 12 megapixels and have low noise circuit designs permitting the direct capture of darkfield and fluorescence images. There are many applications of digital images of pathologic specimens. Since pathology is a visual science, the inclusion of quality digital images into lectures, teaching handouts, and electronic documents is essential. A few institutions have gone beyond the basic application of digital images to developing large electronic hematology atlases, animated, audio-enhanced learning experiences, multidisciplinary Internet conferences, and other innovative applications. Digital images of single microscopic fields (single frame images) are the most widely utilized in hematology education at this time, but single images of many

  13. Improved Space Object Orbit Determination Using CMOS Detectors

    NASA Astrophysics Data System (ADS)

    Schildknecht, T.; Peltonen, J.; Sännti, T.; Silha, J.; Flohrer, T.

    2014-09-01

    CMOS-sensors, or in general Active Pixel Sensors (APS), are rapidly replacing CCDs in the consumer camera market. Due to significant technological advances during the past years these devices start to compete with CCDs also for demanding scientific imaging applications, in particular in the astronomy community. CMOS detectors offer a series of inherent advantages compared to CCDs, due to the structure of their basic pixel cells, which each contains their own amplifier and readout electronics. The most prominent advantages for space object observations are the extremely fast and flexible readout capabilities, feasibility for electronic shuttering and precise epoch registration, and the potential to perform image processing operations on-chip and in real-time. The major challenges and design drivers for ground-based and space-based optical observation strategies have been analyzed. CMOS detector characteristics were critically evaluated and compared with the established CCD technology, especially with respect to the above mentioned observations. Similarly, the desirable on-chip processing functionalities which would further enhance the object detection and image segmentation were identified. Finally, we simulated several observation scenarios for ground- and space-based sensor by assuming different observation and sensor properties. We will introduce the analyzed end-to-end simulations of the ground- and space-based strategies in order to investigate the orbit determination accuracy and its sensitivity which may result from different values for the frame-rate, pixel scale, astrometric and epoch registration accuracies. Two cases were simulated, a survey using a ground-based sensor to observe objects in LEO for surveillance applications, and a statistical survey with a space-based sensor orbiting in LEO observing small-size debris in LEO. The ground-based LEO survey uses a dynamical fence close to the Earth shadow a few hours after sunset. For the space-based scenario

  14. CMOS VLSI Active-Pixel Sensor for Tracking

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata; Sun, Chao; Yang, Guang; Heynssens, Julie

    2004-01-01

    An architecture for a proposed active-pixel sensor (APS) and a design to implement the architecture in a complementary metal oxide semiconductor (CMOS) very-large-scale integrated (VLSI) circuit provide for some advanced features that are expected to be especially desirable for tracking pointlike features of stars. The architecture would also make this APS suitable for robotic- vision and general pointing and tracking applications. CMOS imagers in general are well suited for pointing and tracking because they can be configured for random access to selected pixels and to provide readout from windows of interest within their fields of view. However, until now, the architectures of CMOS imagers have not supported multiwindow operation or low-noise data collection. Moreover, smearing and motion artifacts in collected images have made prior CMOS imagers unsuitable for tracking applications. The proposed CMOS imager (see figure) would include an array of 1,024 by 1,024 pixels containing high-performance photodiode-based APS circuitry. The pixel pitch would be 9 m. The operations of the pixel circuits would be sequenced and otherwise controlled by an on-chip timing and control block, which would enable the collection of image data, during a single frame period, from either the full frame (that is, all 1,024 1,024 pixels) or from within as many as 8 different arbitrarily placed windows as large as 8 by 8 pixels each. A typical prior CMOS APS operates in a row-at-a-time ( grolling-shutter h) readout mode, which gives rise to exposure skew. In contrast, the proposed APS would operate in a sample-first/readlater mode, suppressing rolling-shutter effects. In this mode, the analog readout signals from the pixels corresponding to the windows of the interest (which windows, in the star-tracking application, would presumably contain guide stars) would be sampled rapidly by routing them through a programmable diagonal switch array to an on-chip parallel analog memory array. The

  15. Digital Opportunity

    ERIC Educational Resources Information Center

    Azzam, Amy M.

    2006-01-01

    This article details the content of a recently released report from the Children's Partnership titled "Measuring Digital Opportunity for America's Children: Where We Stand and Where We Go From Here". On the basis of 40 indicators, the report's Digital Opportunity Measuring Stick showed how U.S. children and young adults use information and…

  16. Digital TMI

    NASA Technical Reports Server (NTRS)

    Rios, Joseph

    2012-01-01

    Presenting the current status of the Digital TMI project to visiting members of the FAA Command Center. Digital TMI is an effort to store national-level traffic management initiatives in a standards-compliant manner. Work is funded by the FAA.

  17. Digital Discrimination

    ERIC Educational Resources Information Center

    Blansett, Jim

    2008-01-01

    In recent years, the Internet has become a digital commons of commerce and education. However, accessibility standards have often been overlooked online, and the digital equivalents to curb-cuts and other physical accommodations have only rarely been implemented to serve those with print disabilities. (A print disability can be a learning…

  18. Digital Roundup

    ERIC Educational Resources Information Center

    Horn, Michael B.

    2013-01-01

    State policy is crucial to the spread of digital-learning opportunities at the elementary and secondary level. A review of recent legislative action reveals policies that are constantly in flux and differ quite markedly from one state to another. Some have hoped for model digital-learning legislation that could handle all the various issues…

  19. Why Digitize?

    ERIC Educational Resources Information Center

    Smith, Abby

    This paper is a response to discussions of digitization at meetings of the National Humanities Alliance (NHA). NHA asked the Council on Library and Information Resources (CLIR) to evaluate the experiences of cultural institutions with digitization projects to date and to summarize what has been learned about the advantages and disadvantages of…

  20. Smart pixel technology and an application to two-dimensional analog-to-digital conversion

    NASA Astrophysics Data System (ADS)

    Shoop, Barry L.; Sadowski, Robert W.; Dudevoir, Glen P.; Ressler, Eugene K.; Sayles, Andre H.; Hall, Dirk A.; Litynski, Daniel M.

    1998-12-01

    A short review of smart pixel technology is followed by an application of one specific smart pixel technology to a 2D application of analog-to-digital conversion called digital image halftoning. A novel approach to digital image halftoning is described based on a symmetric error diffusion algorithm, a new form of artificial neural network called an error diffusion neural network, and a smart pixel optoelectronic architecture. Two generations of smart pixel architectures are described that incorporate self-electro- optic effect device (SEED) modulators flip-chip bonded to submicrometer feature size complementary metal-oxide semiconductor (CMOS) silicon circuitry to produce CMOS-SEED implementations of the error diffusion neural network. Simulations and experimental characterizations demonstrate that this hardware approach provides sufficient computational accuracy for the analog neural network while simultaneously providing switching speeds that support halftoning at video rates.

  1. Low Noise and Highly Linear Wideband CMOS RF Front-End for DVB-H Direct-Conversion Receiver

    NASA Astrophysics Data System (ADS)

    Nam, Ilku; Moon, Hyunwon; Woo, Doo Hyung

    In this paper, a wideband CMOS radio frequency (RF) front-end for digital video broadcasting-handheld (DVB-H) receiver is proposed. The RF front-end circuit is composed of a single-ended resistive feedback low noise amplifier (LNA), a single-to-differential amplifier, an I/Q down-conversion mixer with linearized transconductors employing third order intermodulation distortion cancellation, and a divide-by-two circuit with LO buffers. By employing a third order intermodulation (IMD3) cancellation technique and vertical NPN bipolar junction transistor (BJT) switching pair for an I/Q down-conversion mixer, the proposed RF front-end circuit has high linearity and low low-frequency noise performance. It is fabricated in a 0.18µm deep n-well CMOS technology and draws 12mA from a 1.8V supply voltage. It shows a voltage gain of 31dB, a noise figure (NF) lower than 2.6dB, and an IIP3 of -8dBm from 470MHz to 862MHz.

  2. Predicted image quality of a CMOS APS X-ray detector across a range of mammographic beam qualities

    NASA Astrophysics Data System (ADS)

    Konstantinidis, A.

    2015-09-01

    Digital X-ray detectors based on Complementary Metal-Oxide- Semiconductor (CMOS) Active Pixel Sensor (APS) technology have been introduced in the early 2000s in medical imaging applications. In a previous study the X-ray performance (i.e. presampling Modulation Transfer Function (pMTF), Normalized Noise Power Spectrum (NNPS), Signal-to-Noise Ratio (SNR) and Detective Quantum Efficiency (DQE)) of the Dexela 2923MAM CMOS APS X-ray detector was evaluated within the mammographic energy range using monochromatic synchrotron radiation (i.e. 17-35 keV). In this study image simulation was used to predict how the mammographic beam quality affects image quality. In particular, the experimentally measured monochromatic pMTF, NNPS and SNR parameters were combined with various mammographic spectral shapes (i.e. Molybdenum/Molybdenum (Mo/Mo), Rhodium/Rhodium (Rh/Rh), Tungsten/Aluminium (W/Al) and Tungsten/Rhodium (W/Rh) anode/filtration combinations at 28 kV). The image quality was measured in terms of Contrast-to-Noise Ratio (CNR) using a synthetic breast phantom (4 cm thick with 50% glandularity). The results can be used to optimize the imaging conditions in order to minimize patient's Mean Glandular Dose (MGD).

  3. Low-noise low-power readout electronics circuit development in standard CMOS technology for 4 K applications

    NASA Astrophysics Data System (ADS)

    Merken, Patrick; Souverijns, Tim; Putzeys, Jan; Creten, Ybe; Van Hoof, Chris

    2006-06-01

    In the framework of the Photodetector Array Camera and Spectrometer (PACS) project IMEC designed the Cold Readout Electronics (CRE) for the Ge:Ga far-infrared detector array. Key specifications for this circuit were high linearity, low power consumption and low noise at an operating temperature of 4.2K. We have implemented this circuit in a standard CMOS technology which guarantees high yield and uniformity, and design portability. A drawback of this approach is the anomalous behavior of CMOS transistors at temperatures below 30-40K. These cryogenic phenomena disturb the normal functionality of commonly used circuits. We were able to overcome these problems and developed a library of digital and analog building blocks based on the modeling of cryogenic behavior, and on adapted design and layout techniques. We will present the design of the 18 channel CRE circuit, its interface with the Ge:Ga sensor, and its electrical performance. We will show how the library that was developed for PACS served as a baseline for the designs used in the Darwin-far-infrared detector array, where a cryogenic 180 channel, 30μm pitch, Readout Integrated Circuit (ROIC) for flip-chip integration was developed. Other designs and topologies for low noise and low power applications will be equally presented.

  4. Gun muzzle flash detection using a single photon avalanche diode array in 0.18µm CMOS technology

    NASA Astrophysics Data System (ADS)

    Savuskan, Vitali; Jakobson, Claudio; Merhav, Tomer; Shoham, Avi; Brouk, Igor; Nemirovsky, Yael

    2015-05-01

    In this study, a CMOS Single Photon Avalanche Diode (SPAD) 2D array is used to record and sample muzzle flash events in the visible spectrum, from representative weapons. SPADs detect the emission peaks of alkali salts, potassium or sodium, with spectral emission lines around 769nm and 589nm, respectively. The alkali salts are included in the gunpowder to suppress secondary flashes ignited during the muzzle flash event. The SPADs possess two crucial properties for muzzle flash imaging: (i) very high photon detection sensitivity, (ii) a unique ability to convert the optical signal to a digital signal at the source pixel, thus practically eliminating readout noise. The sole noise sources are the ones prior to the readout circuitry (optical signal distribution, avalanche initiation distribution and nonphotonic generation). This enables high sampling frequencies in the kilohertz range without significant SNR degradation, in contrast to regular CMOS image sensors. This research will demonstrate the SPAD's ability to accurately sample and reconstruct the temporal behavior of the muzzle flash in the visible wavelength, in the presence of sunlight. The reconstructed signal is clearly distinguishable from background clutter, through exploitation of flash temporal characteristics and signal processing, which will be reported. The frame rate of ~16 KHz was chosen as an optimum between SNR degradation and temporal profile recognition accuracy. In contrast to a single SPAD, the 2D array allows for multiple events to be processed simultaneously. Moreover, a significant field of view is covered, enabling comprehensive surveillance and imaging.

  5. Large-area low-temperature ultrananocrystaline diamond (UNCD) films and integration with CMOS devices for monolithically integrated diamond MEMD/NEMS-CMOS systems.

    SciTech Connect

    Sumant, A.V.; Auciello, O.; Yuan, H.-C; Ma, Z.; Carpick, R. W.; Mancini, D. C.; Univ. of Wisconsin; Univ. of Pennsylvania

    2009-05-01

    Because of exceptional mechanical, chemical, and tribological properties, diamond has a great potential to be used as a material for the development of high-performance MEMS and NEMS such as resonators and switches compatible with harsh environments, which involve mechanical motion and intermittent contact. Integration of such MEMS/NEMS devices with complementary metal oxide semiconductor (CMOS) microelectronics will provide a unique platform for CMOS-driven commercial MEMS/NEMS. The main hurdle to achieve diamond-CMOS integration is the relatively high substrate temperatures (600-800 C) required for depositing conventional diamond thin films, which are well above the CMOS operating thermal budget (400 C). Additionally, a materials integration strategy has to be developed to enable diamond-CMOS integration. Ultrananocrystalline diamond (UNCD), a novel material developed in thin film form at Argonne, is currently the only microwave plasma chemical vapor deposition (MPCVD) grown diamond film that can be grown at 400 C, and still retain exceptional mechanical, chemical, and tribological properties comparable to that of single crystal diamond. We have developed a process based on MPCVD to synthesize UNCD films on up to 200 mm in diameter CMOS wafers, which will open new avenues for the fabrication of monolithically integrated CMOS-driven MEMS/NEMS based on UNCD. UNCD films were grown successfully on individual Si-based CMOS chips and on 200 mm CMOS wafers at 400 C in a MPCVD system, using Ar-rich/CH4 gas mixture. The CMOS devices on the wafers were characterized before and after UNCD deposition. All devices were performing to specifications with very small degradation after UNCD deposition and processing. A threshold voltage degradation in the range of 0.08-0.44V and transconductance degradation in the range of 1.5-9% were observed.

  6. A fully integrated CMOS inverse sine circuit for computational systems

    NASA Astrophysics Data System (ADS)

    Seon, Jong-Kug

    2010-08-01

    An inverse trigonometric function generator using CMOS technology is presented and implemented. The development and synthesis of inverse trigonometric functional circuits based on the simple approximation equations are also introduced. The proposed inverse sine function generator has the infinite input range and can be used in many measurement and instrumentation systems. The nonlinearity of less than 2.8% for the entire input range of 0.5 Vp-p with a small-signal bandwidth of 3.2 MHz is achieved. The chip implemented in 0.25 μm CMOS process operates from a single 1.8 V supply. The measured power consumption and the active chip area of the inverse sine function circuit are 350 μW and 0.15 mm2, respectively.

  7. Monolithic CMOS-MEMS integration for high-g accelerometers

    NASA Astrophysics Data System (ADS)

    Narasimhan, Vinayak; Li, Holden; Tan, Chuan Seng

    2014-10-01

    This paper highlights work-in-progress towards the conceptualization, simulation, fabrication and initial testing of a silicon-germanium (SiGe) integrated CMOS-MEMS high-g accelerometer for military, munition, fuze and shock measurement applications. Developed on IMEC's SiGe MEMS platform, the MEMS offers a dynamic range of 5,000 g and a bandwidth of 12 kHz. The low noise readout circuit adopts a chopper-stabilization technique implementing the CMOS through the TSMC 0.18 µm process. The device structure employs a fully differential split comb-drive set up with two sets of stators and a rotor all driven separately. Dummy structures acting as protective over-range stops were designed to protect the active components when under impacts well above the designed dynamic range.

  8. TID Simulation of Advanced CMOS Devices for Space Applications

    NASA Astrophysics Data System (ADS)

    Sajid, Muhammad

    2016-07-01

    This paper focuses on Total Ionizing Dose (TID) effects caused by accumulation of charges at silicon dioxide, substrate/silicon dioxide interface, Shallow Trench Isolation (STI) for scaled CMOS bulk devices as well as at Buried Oxide (BOX) layer in devices based on Silicon-On-Insulator (SOI) technology to be operated in space radiation environment. The radiation induced leakage current and corresponding density/concentration electrons in leakage current path was presented/depicted for 180nm, 130nm and 65nm NMOS, PMOS transistors based on CMOS bulk as well as SOI process technologies on-board LEO and GEO satellites. On the basis of simulation results, the TID robustness analysis for advanced deep sub-micron technologies was accomplished up to 500 Krad. The correlation between the impact of technology scaling and magnitude of leakage current with corresponding total dose was established utilizing Visual TCAD Genius program.

  9. Radiation Hard 0.25 Micron CMOS Library at IHP

    NASA Astrophysics Data System (ADS)

    Jagdhold, U.

    2008-08-01

    To support space applications we have produced a test chip with our in house 0.25 micron BiCMOS- Technology. Then the chips were radiated and measured. During measurements no threshold voltage shift and no single event latchup (SEL) were obtained up to a level of 200 krad. As conclusion of the measurement we developed new radiation hard design rules and according to these rules we created a new radiation hard CMOS library. With this new library we produced a Leon3 chip with triple module redundancy. Single event upsets did occur. Therefore we upgrade the library to make the flip flops more resistant against single event upset (SEU) by adding two p-MOS transistors.

  10. A CMOS image sensor dedicated to medical gamma camera application

    NASA Astrophysics Data System (ADS)

    Salahuddin, Nur S.; Paindavoine, Michel; Ginhac, Dominique; Parmentier, Michel; Tamda, Najia

    2005-03-01

    Generally, medical Gamma Camera are based on the Anger principle. These cameras use a scintillator block coupled to a bulky array of photomultiplier tube (PMT). To simplify this, we designed a new integrated CMOS image sensor in order to replace bulky PMT photodetetors. We studied several photodiodes sensors including current mirror amplifiers. These photodiodes have been fabricated using a CMOS 0.6 micrometers process from Austria Mikro Systeme (AMS). Each sensor pixel in the array occupies respectively, 1mm x 1mm area, 0.5mm x 0.5mm area and 0.2mm 0.2mm area with fill factor 98 % and total chip area is 2 square millimeters. The sensor pixels show a logarithmic response in illumination and are capable of detecting very low green light emitting diode (less than 0.5 lux) . These results allow to use our sensor in new Gamma Camera solid-state concept.

  11. Diffuse reflectance measurements using lensless CMOS imaging chip

    NASA Astrophysics Data System (ADS)

    Schelkanova, I.; Pandya, A.; Shah, D.; Lilge, L.; Douplik, A.

    2014-10-01

    To assess superficial epithelial microcirculation, a diagnostic tool should be able to detect the heterogeneity of microvasculature, and to monitor qualitative derangement of perfusion in a diseased condition. Employing a lensless CMOS imaging chip with an RGB Bayer filter, experiments were conducted with a microfluidic platform to obtain diffuse reflectance maps. Haemoglobin (Hb) solution (160 g/l) was injected in the periodic channels (grooves) of the microfluidic phantom which were covered with ~250 μm thick layer of intralipid to obtain a diffusive environment. Image processing was performed on data acquired on the surface of the phantom to evaluate the diffuse reflectance from the subsurface periodic pattern. Thickness of the microfluidic grooves, the wavelength dependent contrast between Hb and the background, and effective periodicity of the grooves were evaluated. Results demonstrate that a lens-less CMOS camera is capable of capturing images of subsurface structures with large field of view.

  12. A back-illuminated megapixel CMOS image sensor

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata; Cunningham, Thomas; Nikzad, Shouleh; Hoenk, Michael; Jones, Todd; Wrigley, Chris; Hancock, Bruce

    2005-01-01

    In this paper, we present the test and characterization results for a back-illuminated megapixel CMOS imager. The imager pixel consists of a standard junction photodiode coupled to a three transistor-per-pixel switched source-follower readout [1]. The imager also consists of integrated timing and control and bias generation circuits, and provides analog output. The analog column-scan circuits were implemented in such a way that the imager could be configured to run in off-chip correlated double-sampling (CDS) mode. The imager was originally designed for normal front-illuminated operation, and was fabricated in a commercially available 0.5 pn triple-metal CMOS-imager compatible process. For backside illumination, the imager was thinned by etching away the substrate was etched away in a post-fabrication processing step.

  13. A CMOS integrated timing discriminator circuit for fast scintillation counters

    SciTech Connect

    Jochmann, M.W.

    1998-06-01

    Based on a zero-crossing discriminator using a CR differentiation network for pulse shaping, a new CMOS integrated timing discriminator circuit is proposed for fast (t{sub r} {ge} 2 ns) scintillation counters at the cooler synchrotron COSY-Juelich. By eliminating the input signal`s amplitude information by means of an analog continuous-time divider, a normalized pulse shape at the zero-crossing point is gained over a wide dynamic input amplitude range. In combination with an arming comparator and a monostable multivibrator this yields in a highly precise timing discriminator circuit, that is expected to be useful in different time measurement applications. First measurement results of a CMOS integrated logarithmic amplifier, which is part of the analog continuous-time divider, agree well with the corresponding simulations. Moreover, SPICE simulations of the integrated discriminator circuit promise a time walk well below 200 ps (FWHM) over a 40 dB input amplitude dynamic range.

  14. A Brief Discussion of Radiation Hardening of CMOS Microelectronics

    SciTech Connect

    Myers, D.R.

    1998-12-18

    Commercial microchips work well in their intended environments. However, generic microchips will not fimction correctly if exposed to sufficient amounts of ionizing radiation, the kind that satellites encounter in outer space. Modern CMOS circuits must overcome three specific concerns from ionizing radiation: total-dose, single-event, and dose-rate effects. Minority-carrier devices such as bipolar transistors, optical receivers, and solar cells must also deal with recombination-generation centers caused by displacement damage, which are not major concerns for majority-carrier CMOS devices. There are ways to make the chips themselves more resistant to radiation. This extra protection, called radiation hardening, has been called both a science and an art. Radiation hardening requires both changing the designs of the chips and altering the ways that the chips are manufactured.

  15. Characterization of imaging performance of a large-area CMOS active-pixel detector for low-energy X-ray imaging

    NASA Astrophysics Data System (ADS)

    Hwy Lim, Chang; Yun, Seungman; Chul Han, Jong; Kim, Ho Kyung; Farrier, Michael G.; Graeve Achterkirchen, Thorsten; McDonald, Mike; Cunningham, Ian A.

    2011-10-01

    We report the imaging characteristics of the recently developed large-area complementary metal-oxide-semiconductor (CMOS) active-pixel detector for low-energy digital X-ray imaging applications. The detector consists of a scintillator to convert X-ray into light and a photodiode pixel array made by the CMOS fabrication process to convert light into charge signals. Between two layers, we introduce a fiber-optic faceplate (FOP) to avoid direct absorption of X-ray photons in the photodiode array. A single pixel is composed of a photodiode and three transistors, and the pixel pitch is 96 μm. The imaging characteristics of the detector have been investigated in terms of modulation-transfer function (MTF), noise-power spectrum (NPS), and detective quantum efficiency (DQE). From the measured results, the MTF at the Nyquist frequency is about 20% and the DQE around zero-spatial frequency is about 40%. Simple cascaded linear-systems analysis has showed that the FOP prevents direct absorption of X-ray photons within the CMOS photodiode array, leading to a lower NPS and consequently improved DQE especially at high spatial frequencies.

  16. Low-Voltage 96 dB Snapshot CMOS Image Sensor with 4.5 nW Power Dissipation per Pixel

    PubMed Central

    Spivak, Arthur; Teman, Adam; Belenky, Alexander; Yadid-Pecht, Orly; Fish, Alexander

    2012-01-01

    Modern “smart” CMOS sensors have penetrated into various applications, such as surveillance systems, bio-medical applications, digital cameras, cellular phones and many others. Reducing the power of these sensors continuously challenges designers. In this paper, a low power global shutter CMOS image sensor with Wide Dynamic Range (WDR) ability is presented. This sensor features several power reduction techniques, including a dual voltage supply, a selective power down, transistors with different threshold voltages, a non-rationed logic, and a low voltage static memory. A combination of all these approaches has enabled the design of the low voltage “smart” image sensor, which is capable of reaching a remarkable dynamic range, while consuming very low power. The proposed power-saving solutions have allowed the maintenance of the standard architecture of the sensor, reducing both the time and the cost of the design. In order to maintain the image quality, a relation between the sensor performance and power has been analyzed and a mathematical model, describing the sensor Signal to Noise Ratio (SNR) and Dynamic Range (DR) as a function of the power supplies, is proposed. The described sensor was implemented in a 0.18 um CMOS process and successfully tested in the laboratory. An SNR of 48 dB and DR of 96 dB were achieved with a power dissipation of 4.5 nW per pixel. PMID:23112588

  17. Low-voltage 96 dB snapshot CMOS image sensor with 4.5 nW power dissipation per pixel.

    PubMed

    Spivak, Arthur; Teman, Adam; Belenky, Alexander; Yadid-Pecht, Orly; Fish, Alexander

    2012-01-01

    Modern "smart" CMOS sensors have penetrated into various applications, such as surveillance systems, bio-medical applications, digital cameras, cellular phones and many others. Reducing the power of these sensors continuously challenges designers. In this paper, a low power global shutter CMOS image sensor with Wide Dynamic Range (WDR) ability is presented. This sensor features several power reduction techniques, including a dual voltage supply, a selective power down, transistors with different threshold voltages, a non-rationed logic, and a low voltage static memory. A combination of all these approaches has enabled the design of the low voltage "smart" image sensor, which is capable of reaching a remarkable dynamic range, while consuming very low power. The proposed power-saving solutions have allowed the maintenance of the standard architecture of the sensor, reducing both the time and the cost of the design. In order to maintain the image quality, a relation between the sensor performance and power has been analyzed and a mathematical model, describing the sensor Signal to Noise Ratio (SNR) and Dynamic Range (DR) as a function of the power supplies, is proposed. The described sensor was implemented in a 0.18 um CMOS process and successfully tested in the laboratory. An SNR of 48 dB and DR of 96 dB were achieved with a power dissipation of 4.5 nW per pixel. PMID:23112588

  18. Hardening of commercial CMOS PROMs with polysilicon fusible links

    NASA Technical Reports Server (NTRS)

    Newman, W. H.; Rauchfuss, J. E.

    1985-01-01

    The method by which a commercial 4K CMOS PROM with polysilicon fuses was hardened and the feasibility of applying this method to a 16K PROM are presented. A description of the process and the necessary minor modifications to the original layout are given. The PROM circuit and discrete device characteristics over radiation to 1000K rad-Si are summarized. The dose rate sensitivity of the 4K PROMs is also presented.

  19. CMOS floating-point vector-arithmetic unit

    NASA Astrophysics Data System (ADS)

    Timmermann, D.; Rix, B.; Hahn, H.; Hosticka, B. J.

    1994-05-01

    This work describes a floating-point arithmetic unit based on the CORDIC algorithm. The unit computes a full set of high level arithmetic and elementary functions: multiplication, division, (co)sine, hyperbolic (co)sine, square root, natural logarithm, inverse (hyperbolic) tangent, vector norm, and phase. The chip has been integrated in 1.6 micron double-metal n-well CMOS technology and achieves a normalized peak performance of 220 MFLOPS.

  20. Accelerated life testing effects on CMOS microcircuit characteristics, phase 1

    NASA Technical Reports Server (NTRS)

    Maximow, B.

    1976-01-01

    An accelerated life test of sufficient duration to generate a minimum of 50% cumulative failures in lots of CMOS devices was conducted to provide a basis for determining the consistency of activation energy at 250 C. An investigation was made to determine whether any thresholds were exceeded during the high temperature testing, which could trigger failure mechanisms unique to that temperature. The usefulness of the 250 C temperature test as a predictor of long term reliability was evaluated.

  1. A BiCMOS integrated charge to amplitude converter

    SciTech Connect

    Gallin-Martel, L.; Pouxe, J.; Rossetto, O.

    1996-12-31

    This paper describes a fast two channel gated charge to amplitude converter (QAC) which has been designed with the 1.2 {mu}m BiCMOS technology from AMS (Austria Mikro Systeme). It can integrate fast negative impulse currents up to 100 mA. Associated with an audio 18 bit low cost ADC, it can easily be used to make a 12 to 13 bit QDC. The problems of current to current conversion, pedestal and offset stability are discussed.

  2. Linear dynamic range enhancement in a CMOS imager

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata (Inventor)

    2008-01-01

    A CMOS imager with increased linear dynamic range but without degradation in noise, responsivity, linearity, fixed-pattern noise, or photometric calibration comprises a linear calibrated dual gain pixel in which the gain is reduced after a pre-defined threshold level by switching in an additional capacitance. The pixel may include a novel on-pixel latch circuit that is used to switch in the additional capacitance.

  3. Design and initial performance evaluation of a full field digital mammography upgrade cassette

    PubMed Central

    Nguyen, D; Baysal, MA; Toker, E; Wang, JM

    2008-01-01

    This paper discusses the criteria underlying the design of an innovative X-ray active pixel sensor in CMOS technology. This X-ray detector is used in a Full Field-of-view Digital Mammography (FFDM) camera. The CMOS imager is a three-side buttable 29mm × 119mm, 48 μm active pixel CMOS sensor in 0.18 μm technology. The 1st silicon FFDM devices were fabricated at the end of June, 2007. The device suffers a common failure mode of high current and currently is in failure analysis at Bioptics foundry. Current target for revision A1 tape out is at the end of August, 2007. PMID:18958298

  4. Design and initial performance evaluation of a full field digital mammography upgrade cassette.

    PubMed

    Nguyen, D; Baysal, Ma; Toker, E; Wang, Jm

    2007-09-01

    This paper discusses the criteria underlying the design of an innovative X-ray active pixel sensor in CMOS technology. This X-ray detector is used in a Full Field-of-view Digital Mammography (FFDM) camera. The CMOS imager is a three-side buttable 29mm x 119mm, 48 mum active pixel CMOS sensor in 0.18 mum technology. The 1(st) silicon FFDM devices were fabricated at the end of June, 2007. The device suffers a common failure mode of high current and currently is in failure analysis at Bioptics foundry. Current target for revision A1 tape out is at the end of August, 2007. PMID:18958298

  5. Hybrid Integration of Graphene Analog and Silicon Complementary Metal-Oxide-Semiconductor Digital Circuits.

    PubMed

    Hong, Seul Ki; Kim, Choong Sun; Hwang, Wan Sik; Cho, Byung Jin

    2016-07-26

    We demonstrate a hybrid integration of a graphene-based analog circuit and a silicon-based digital circuit in order to exploit the strengths of both graphene and silicon devices. This mixed signal circuit integration was achieved using a three-dimensional (3-D) integration technique where a graphene FET multimode phase shifter is fabricated on top of a silicon complementary metal-oxide-semiconductor field-effect transistor (CMOS FET) ring oscillator. The process integration scheme presented here is compatible with the conventional silicon CMOS process, and thus the graphene circuit can successfully be integrated on current semiconductor technology platforms for various applications. This 3-D integration technique allows us to take advantage of graphene's excellent inherent properties and the maturity of current silicon CMOS technology for future electronics. PMID:27403730

  6. CMOS integration of inkjet-printed graphene for humidity sensing

    NASA Astrophysics Data System (ADS)

    Santra, S.; Hu, G.; Howe, R. C. T.; de Luca, A.; Ali, S. Z.; Udrea, F.; Gardner, J. W.; Ray, S. K.; Guha, P. K.; Hasan, T.

    2015-11-01

    We report on the integration of inkjet-printed graphene with a CMOS micro-electro-mechanical-system (MEMS) microhotplate for humidity sensing. The graphene ink is produced via ultrasonic assisted liquid phase exfoliation in isopropyl alcohol (IPA) using polyvinyl pyrrolidone (PVP) polymer as the stabilizer. We formulate inks with different graphene concentrations, which are then deposited through inkjet printing over predefined interdigitated gold electrodes on a CMOS microhotplate. The graphene flakes form a percolating network to render the resultant graphene-PVP thin film conductive, which varies in presence of humidity due to swelling of the hygroscopic PVP host. When the sensors are exposed to relative humidity ranging from 10-80%, we observe significant changes in resistance with increasing sensitivity from the amount of graphene in the inks. Our sensors show excellent repeatability and stability, over a period of several weeks. The location specific deposition of functional graphene ink onto a low cost CMOS platform has the potential for high volume, economic manufacturing and application as a new generation of miniature, low power humidity sensors for the internet of things.

  7. Aluminum nitride on titanium for CMOS compatible piezoelectric transducers

    PubMed Central

    Doll, Joseph C; Petzold, Bryan C; Ninan, Biju; Mullapudi, Ravi; Pruitt, Beth L

    2010-01-01

    Piezoelectric materials are widely used for microscale sensors and actuators but can pose material compatibility challenges. This paper reports a post-CMOS compatible fabrication process for piezoelectric sensors and actuators on silicon using only standard CMOS metals. The piezoelectric properties of aluminum nitride (AlN) deposited on titanium (Ti) by reactive sputtering are characterized and microcantilever actuators are demonstrated. The film texture of the polycrystalline Ti and AlN films is improved by removing the native oxide from the silicon substrate in situ and sequentially depositing the films under vacuum to provide a uniform growth surface. The piezoelectric properties for several AlN film thicknesses are measured using laser doppler vibrometry on unpatterned wafers and released cantilever beams. The film structure and properties are shown to vary with thickness, with values of d33f, d31 and d33 of up to 2.9, −1.9 and 6.5 pm V−1, respectively. These values are comparable with AlN deposited on a Pt metal electrode, but with the benefit of a fabrication process that uses only standard CMOS metals. PMID:20333316

  8. Fully depleted, thick, monolithic CMOS pixels with high quantum efficiency

    NASA Astrophysics Data System (ADS)

    Clarke, A.; Stefanov, K.; Johnston, N.; Holland, A.

    2015-04-01

    The Centre for Electronic Imaging (CEI) has an active programme of evaluating and designing Complementary Metal-Oxide Semiconductor (CMOS) image sensors with high quantum efficiency, for applications in near-infrared and X-ray photon detection. This paper describes the performance characterisation of CMOS devices made on a high resistivity 50 μ m thick p-type substrate with a particular focus on determining the depletion depth and the quantum efficiency. The test devices contain 8 × 8 pixel arrays using CCD-style charge collection, which are manufactured in a low voltage CMOS process by ESPROS Photonics Corporation (EPC). Measurements include determining under which operating conditions the devices become fully depleted. By projecting a spot using a microscope optic and a LED and biasing the devices over a range of voltages, the depletion depth will change, causing the amount of charge collected in the projected spot to change. We determine if the device is fully depleted by measuring the signal collected from the projected spot. The analysis of spot size and shape is still under development.

  9. Development of CMOS Imager Block for Capsule Endoscope

    NASA Astrophysics Data System (ADS)

    Shafie, S.; Fodzi, F. A. M.; Tung, L. Q.; Lioe, D. X.; Halin, I. A.; Hasan, W. Z. W.; Jaafar, H.

    2014-04-01

    This paper presents the development of imager block to be associated in a capsule endoscopy system. Since the capsule endoscope is used to diagnose gastrointestinal diseases, the imager block must be in small size which is comfortable for the patients to swallow. In this project, a small size 1.5V button battery is used as the power supply while the voltage supply requirements for other components such as microcontroller and CMOS image sensor are higher. Therefore, a voltage booster circuit is proposed to boost up the voltage supply from 1.5V to 3.3V. A low power microcontroller is used to generate control pulses for the CMOS image sensor and to convert the 8-bits parallel data output to serial data to be transmitted to the display panel. The results show that the voltage booster circuit was able to boost the voltage supply from 1.5V to 3.3V. The microcontroller precisely controls the CMOS image sensor to produce parallel data which is then serialized again by the microcontroller. The serial data is then successfully translated to 2fps image and displayed on computer.

  10. Neuronal cell biocompatibility and adhesion to modified CMOS electrodes.

    PubMed

    Graham, Anthony H D; Bowen, Chris R; Taylor, John; Robbins, Jon

    2009-10-01

    The use of CMOS (Complementary Metal Oxide Semiconductor) integrated circuits to create electrodes for biosensors, implants and drug-discovery has several potential advantages over passive multi-electrode arrays (MEAs). However, unmodified aluminium CMOS electrodes may corrode in a physiological environment. We have investigated a low-cost electrode design based on the modification of CMOS metallisation to produce a nanoporous alumina electrode as an interface to mammalian neuronal cells and corrosion inhibitor. Using NG108-15 mouse neuroblastoma x rat glioma hybrid cells, results show that porous alumina is biocompatible and that the inter-pore distance (pore pitch) of the alumina has no effect on cell vitality. To establish whether porous alumina and a cell membrane can produce a tight junction required for good electrical coupling between electrode and cell, we devised a novel cell detachment centrifugation assay to assess the long-term adhesion of cells. Results show that porous alumina substrates produced with a large pore pitch of 206 nm present a significantly improved surface compared to the unmodified aluminium control and that small pore-pitches of 17 nm and 69 nm present a less favourable surface for cell adhesion. PMID:19459049

  11. CMOS-compatible graphene photodetector covering all optical communication bands

    NASA Astrophysics Data System (ADS)

    Pospischil, Andreas; Humer, Markus; Furchi, Marco M.; Bachmann, Dominic; Guider, Romain; Fromherz, Thomas; Mueller, Thomas

    2013-11-01

    Optical interconnects are becoming attractive alternatives to electrical wiring in intra- and interchip communication links. Particularly, the integration with silicon complementary metal-oxide semiconductor (CMOS) technology has received considerable interest because of the ability of cost-effective integration of electronics and optics on a single chip. Although silicon enables the realization of optical waveguides and passive components, the integration of another, optically absorbing, material is required for photodetection. Traditionally, germanium or compound semiconductors are used for this purpose; however, their integration with silicon technology faces major challenges. Recently, graphene emerged as a viable alternative for optoelectronic applications, including photodetection. Here, we demonstrate an ultra-wideband CMOS-compatible photodetector based on graphene. We achieved a multigigahertz operation over all fibre-optic telecommunication bands beyond the wavelength range of strained germanium photodetectors, the responsivity of which is limited by their bandgap. Our work complements the recent demonstration of a CMOS-integrated graphene electro-optical modulator, and paves the way for carbon-based optical interconnects.

  12. A CMOS TDI image sensor for Earth observation

    NASA Astrophysics Data System (ADS)

    Rushton, Joseph E.; Stefanov, Konstantin D.; Holland, Andrew D.; Endicott, James; Mayer, Frederic; Barbier, Frederic

    2015-09-01

    Time Delay and Integration (TDI) is used to increase the Signal to Noise Ratio (SNR) in image sensors when imaging fast moving objects. One important TDI application is in Earth observation from space. In order to operate in the space radiation environment, the effect that radiation damage has on the performance of the image sensors must be understood. This work looks at prototype TDI sensor pixel designs, produced by e2v technologies. The sensor is a CCD-like charge transfer device, allowing in-pixel charge summation, produced on a CMOS process. The use of a CMOS process allows potential advantages such as lower power consumption, smaller pixels, higher line rate and extra on-chip functionality which can simplify system design. CMOS also allows a dedicated output amplifier per column allowing fewer charge transfers and helping to facilitate higher line rates than CCDs. In this work the effect on the pixels of radiation damage from high energy protons, at doses relevant to a low Earth orbit mission, is presented. This includes the resulting changes in Charge Transfer inefficiency (CTI) and dark signal.

  13. Polycrystalline Mercuric Iodide Films on CMOS Readout Arrays

    PubMed Central

    Hartsough, Neal E.; Iwanczyk, Jan S.; Nygard, Einar; Malakhov, Nail; Barber, William C.; Gandhi, Thulasidharan

    2009-01-01

    We have created high-resolution x-ray imaging devices using polycrystalline mercuric iodide (HgI2) films grown directly onto CMOS readout chips using a thermal vapor transport process. Images from prototype 400×400 pixel HgI2-coated CMOS readout chips are presented, where the pixel grid is 30 μm × 30 μm. The devices exhibited sensitivity of 6.2 μC/Rcm2 with corresponding dark current of ∼2.7 nA/cm2, and a 80 μm FWHM planar image response to a 50 μm slit aperture. X-ray CT images demonstrate a point spread function sufficient to obtain a 50 μm spatial resolution in reconstructed CT images at a substantially reduced dose compared to phosphor-coated readouts. The use of CMOS technology allows for small pixels (30 μm), fast readout speeds (8 fps for a 3200×3200 pixel array), and future design flexibility due to the use of well-developed fabrication processes. PMID:20161098

  14. CMOS integration of inkjet-printed graphene for humidity sensing.

    PubMed

    Santra, S; Hu, G; Howe, R C T; De Luca, A; Ali, S Z; Udrea, F; Gardner, J W; Ray, S K; Guha, P K; Hasan, T

    2015-01-01

    We report on the integration of inkjet-printed graphene with a CMOS micro-electro-mechanical-system (MEMS) microhotplate for humidity sensing. The graphene ink is produced via ultrasonic assisted liquid phase exfoliation in isopropyl alcohol (IPA) using polyvinyl pyrrolidone (PVP) polymer as the stabilizer. We formulate inks with different graphene concentrations, which are then deposited through inkjet printing over predefined interdigitated gold electrodes on a CMOS microhotplate. The graphene flakes form a percolating network to render the resultant graphene-PVP thin film conductive, which varies in presence of humidity due to swelling of the hygroscopic PVP host. When the sensors are exposed to relative humidity ranging from 10-80%, we observe significant changes in resistance with increasing sensitivity from the amount of graphene in the inks. Our sensors show excellent repeatability and stability, over a period of several weeks. The location specific deposition of functional graphene ink onto a low cost CMOS platform has the potential for high volume, economic manufacturing and application as a new generation of miniature, low power humidity sensors for the internet of things. PMID:26616216

  15. CMOS integration of inkjet-printed graphene for humidity sensing

    PubMed Central

    Santra, S.; Hu, G.; Howe, R. C. T.; De Luca, A.; Ali, S. Z.; Udrea, F.; Gardner, J. W.; Ray, S. K.; Guha, P. K.; Hasan, T.

    2015-01-01

    We report on the integration of inkjet-printed graphene with a CMOS micro-electro-mechanical-system (MEMS) microhotplate for humidity sensing. The graphene ink is produced via ultrasonic assisted liquid phase exfoliation in isopropyl alcohol (IPA) using polyvinyl pyrrolidone (PVP) polymer as the stabilizer. We formulate inks with different graphene concentrations, which are then deposited through inkjet printing over predefined interdigitated gold electrodes on a CMOS microhotplate. The graphene flakes form a percolating network to render the resultant graphene-PVP thin film conductive, which varies in presence of humidity due to swelling of the hygroscopic PVP host. When the sensors are exposed to relative humidity ranging from 10–80%, we observe significant changes in resistance with increasing sensitivity from the amount of graphene in the inks. Our sensors show excellent repeatability and stability, over a period of several weeks. The location specific deposition of functional graphene ink onto a low cost CMOS platform has the potential for high volume, economic manufacturing and application as a new generation of miniature, low power humidity sensors for the internet of things. PMID:26616216

  16. First result on biased CMOS MAPs-on-diamond devices

    NASA Astrophysics Data System (ADS)

    Kanxheri, K.; Citroni, M.; Fanetti, S.; Lagomarsino, S.; Morozzi, A.; Parrini, G.; Passeri, D.; Sciortino, S.; Servoli, L.

    2015-10-01

    Recently a new type of device, the MAPS-on-diamond, obtained bonding a thinned to 25 μm CMOS Monolithic Active Pixel Sensor to a standard 500 μm pCVD diamond substrate, has been proposed and fabricated, allowing a highly segmented readout (10×10 μm pixel size) of the signal produced in the diamond substrate. The bonding between the two materials has been obtained using a new laser technique to deliver the needed energy at the interface. A biasing scheme has been adopted to polarize the diamond substrate to allow the charge transport inside the diamond without disrupting the functionalities of the CMOS Monolithic Active Pixel Sensor. The main concept of this class of devices is the capability of the charges generated in the diamond by ionizing radiation to cross the silicon-diamond interface and to be collected by the MAPS photodiodes. In this work we demonstrate that such passage occurs and measure its overall efficiency. This study has been carried out first calibrating the CMOS MAPS with monochromatic X-rays, and then testing the device with charged particles (electrons) either with and without biasing the diamond substrate, to compare the amount of signal collected.

  17. CMOS-liquid-crystal-based image transceiver device

    NASA Astrophysics Data System (ADS)

    Efron, Uzi; Davidov, Isak; Sinelnikov, Vladimir; Levin, Ilya

    2001-05-01

    A CMOS-Liquid Crystal-Based Image Transceiver Device (ITD) is under development at the Holon Institute of Technology. The device combines both functions of imaginary and display in a single array structure. This unique structure allows the combination of see-through, aiming, imaging and the displaying of a superposed image to be combined in a single, compact, head mounted display. The CMOS-based pixel elements are designed to provide image sensor part of the pixel is based on an n-well photodiode and a three-transistors readout circuit. The imaging function is based on a back- illuminated sensor configuration. In order to provide a high imager fill-factor, two pixel configuration are proposed: 1) A p++/p-/p-well silicon structure using twin- well CMOS process; 2) an n-well processed silicon structure with a micro-lens array. The display portion of the IT device is to be fabricate don a silicon-based reflective, active matrix driver, using nematic liquid crystal material. The reflective display pixel electrode is driven by an n-MOS transistor, formed in the corresponding pixel region on the silicon substrate. The timing, sequencing and control of the IT device array are designed in a pipeline array processing scheme. A preliminary prototype system and device design have been performed and the first test device is currently being tested. Details of the device design as well as its smart goggle applications are presented.

  18. CMOS/LCOS-based image transceiver device: II

    NASA Astrophysics Data System (ADS)

    Efron, Uzi; Davidov, Isak; Sinelnikov, Vladimir; Friesem, Asher A.

    2001-11-01

    A CMOS-liquid crystal-based image transceiver device (ITD) is under development at the Holon Institute of Technology. The device combines both functions of imaging and display in a single array configuration. This unique structure allows the combination of see-through, aiming, imaging and the displaying of a superposed image to be combined in a single, compact, head mounted display. The CMOS-based pixel elements are designed to provide efficient imaging in the visible range as well as driver capabilities for the overlying liquid crystal modulator. The image sensor part of the pixel is based on an n-well photodiode and a three-transistor readout circuit. The imaging function is based on a back- illuminated sensor configuration. In order to provide a high imager fill-factor, two pixel configurations are proposed: 1) A p++/p-/p-well silicon structure using twin- well CMOS process; 2) An n-well processed silicon structure with a micro-lens array. The display portion of the IT device is to be fabricated on a silicon-based reflective, active matrix driver, using nematic liquid crystal material, in LCOS technology. The timing, sequencing and control of the IT device array are designed in a pipeline array processing scheme. A preliminary prototype system and device design have been performed and the first test device is currently undergoing testing. Details of the device design as well as its Smart Goggle applications are presented.

  19. Aluminum nitride on titanium for CMOS compatible piezoelectric transducers

    NASA Astrophysics Data System (ADS)

    Doll, Joseph C.; Petzold, Bryan C.; Ninan, Biju; Mullapudi, Ravi; Pruitt, Beth L.

    2010-02-01

    Piezoelectric materials are widely used for microscale sensors and actuators but can pose material compatibility challenges. This paper reports a post-CMOS compatible fabrication process for piezoelectric sensors and actuators on silicon using only standard CMOS metals. The piezoelectric properties of aluminum nitride (AlN) deposited on titanium (Ti) by reactive sputtering are characterized and microcantilever actuators are demonstrated. The film texture of the polycrystalline Ti and AlN films is improved by removing the native oxide from the silicon substrate in situ and sequentially depositing the films under vacuum to provide a uniform growth surface. The piezoelectric properties for several AlN film thicknesses are measured using laser doppler vibrometry on unpatterned wafers and released cantilever beams. The film structure and properties are shown to vary with thickness, with values of d33f, d31 and d33 of up to 2.9, -1.9 and 6.5 pm V-1, respectively. These values are comparable with AlN deposited on a Pt metal electrode, but with the benefit of a fabrication process that uses only standard CMOS metals.

  20. Self-Calibrated Humidity Sensor in CMOS without Post-Processing

    PubMed Central

    Nizhnik, Oleg; Higuchi, Kohei; Maenaka, Kazusuke

    2012-01-01

    A 1.1 μW power dissipation, voltage-output humidity sensor with 10% relative humidity accuracy was developed in the LFoundry 0.15 μm CMOS technology without post-processing. The sensor consists of a woven lateral array of electrodes implemented in CMOS top metal, a humidity-sensitive layer of Intervia Photodielectric 8023D-10, a CMOS capacitance to voltage converter, and the self-calibration circuitry. PMID:22368466

  1. Single photon detection and localization accuracy with an ebCMOS camera

    NASA Astrophysics Data System (ADS)

    Cajgfinger, T.; Dominjon, A.; Barbier, R.

    2015-07-01

    The CMOS sensor technologies evolve very fast and offer today very promising solutions to existing issues facing by imaging camera systems. CMOS sensors are very attractive for fast and sensitive imaging thanks to their low pixel noise (1e-) and their possibility of backside illumination. The ebCMOS group of IPNL has produced a camera system dedicated to Low Light Level detection and based on a 640 kPixels ebCMOS with its acquisition system. After reminding the principle of detection of an ebCMOS and the characteristics of our prototype, we confront our camera to other imaging systems. We compare the identification efficiency and the localization accuracy of a point source by four different photo-detection devices: the scientific CMOS (sCMOS), the Charge Coupled Device (CDD), the Electron Multiplying CCD (emCCD) and the Electron Bombarded CMOS (ebCMOS). Our ebCMOS camera is able to identify a single photon source in less than 10 ms with a localization accuracy better than 1 μm. We report as well efficiency measurement and the false positive identification of the ebCMOS camera by identifying more than hundreds of single photon sources in parallel. About 700 spots are identified with a detection efficiency higher than 90% and a false positive percentage lower than 5. With these measurements, we show that our target tracking algorithm can be implemented in real time at 500 frames per second under a photon flux of the order of 8000 photons per frame. These results demonstrate that the ebCMOS camera concept with its single photon detection and target tracking algorithm is one of the best devices for low light and fast applications such as bioluminescence imaging, quantum dots tracking or adaptive optics.

  2. Superconductor Digital Electronics: -- Current Status, Future Prospects

    NASA Astrophysics Data System (ADS)

    Mukhanov, Oleg

    2011-03-01

    Two major applications of superconductor electronics: communications and supercomputing will be presented. These areas hold a significant promise of a large impact on electronics state-of-the-art for the defense and commercial markets stemming from the fundamental advantages of superconductivity: simultaneous high speed and low power, lossless interconnect, natural quantization, and high sensitivity. The availability of relatively small cryocoolers lowered the foremost market barrier for cryogenically-cooled superconductor electronic systems. These fundamental advantages enabled a novel Digital-RF architecture - a disruptive technological approach changing wireless communications, radar, and surveillance system architectures dramatically. Practical results were achieved for Digital-RF systems in which wide-band, multi-band radio frequency signals are directly digitized and digital domain is expanded throughout the entire system. Digital-RF systems combine digital and mixed signal integrated circuits based on Rapid Single Flux Quantum (RSFQ) technology, superconductor analog filter circuits, and semiconductor post-processing circuits. The demonstrated cryocooled Digital-RF systems are the world's first and fastest directly digitizing receivers operating with live satellite signals, enabling multi-net data links, and performing signal acquisition from HF to L-band with 30 GHz clock frequencies. In supercomputing, superconductivity leads to the highest energy efficiencies per operation. Superconductor technology based on manipulation and ballistic transfer of magnetic flux quanta provides a superior low-power alternative to CMOS and other charge-transfer based device technologies. The fundamental energy consumption in SFQ circuits defined by flux quanta energy 2 x 10-19 J. Recently, a novel energy-efficient zero-static-power SFQ technology, eSFQ/ERSFQ was invented, which retains all advantages of standard RSFQ circuits: high-speed, dc power, internal memory. The

  3. A 0.0016 mm2 0.64 nJ Leakage-Based CMOS Temperature Sensor

    PubMed Central

    Ituero, Pablo; López-Vallejo, Marisa; López-Barrio, Carlos

    2013-01-01

    This paper presents a CMOS temperature sensor based on the thermal dependencies of the leakage currents targeting the 65 nm node. To compensate for the effect of process fluctuations, the proposed sensor realizes the ratio of two measures of the time it takes a capacitor to discharge through a transistor in the subthreshold regime. Furthermore, a novel charging mechanism for the capacitor is proposed to further increase the robustness against fabrication variability. The sensor, including digitization and interfacing, occupies 0.0016 mm2 and has an energy consumption of 47.7–633 pJ per sample. The resolution of the sensor is 0.28 °C, and the 3σ inaccuracy over the range 40–110 °C is 1.17 °C. PMID:24051526

  4. A reconfigurable medically cohesive biomedical front-end with ΣΔ ADC in 0.18µm CMOS.

    PubMed

    Jha, Pankaj; Patra, Pravanjan; Naik, Jairaj; Acharya, Amit; Rajalakshmi, P; Singh, Shiv Govind; Dutta, Ashudeb

    2015-08-01

    This paper presents a generic programmable analog front-end (AFE) for acquisition and digitization of various biopotential signals. This includes a lead-off detection circuit, an ultra-low current capacitively coupled signal conditioning stage with programmable gain and bandwidth, a new mixed signal automatic gain control (AGC) mechanism and a medically cohesive reconfigurable ΣΔ ADC. The full system is designed in UMC 0.18μm CMOS. The AFE achieves an overall linearity of more 10 bits with 0.47μW power consumption. The ADC provides 2(nd) order noise-shaping while using single integrator and an ENOB of ~11 bits with 5μW power consumption. The system was successfully verified for various ECG signals from PTB database. This system is intended for portable batteryless u-Healthcare devices. PMID:26736391

  5. Real-time, continuous, fluorescence sensing in a freely-moving subject with an implanted hybrid VCSEL/CMOS biosensor

    PubMed Central

    O’Sullivan, Thomas D.; Heitz, Roxana T.; Parashurama, Natesh; Barkin, David B.; Wooley, Bruce A.; Gambhir, Sanjiv S.; Harris, James S.; Levi, Ofer

    2013-01-01

    Performance improvements in instrumentation for optical imaging have contributed greatly to molecular imaging in living subjects. In order to advance molecular imaging in freely moving, untethered subjects, we designed a miniature vertical-cavity surface-emitting laser (VCSEL)-based biosensor measuring 1cm3 and weighing 0.7g that accurately detects both fluorophore and tumor-targeted molecular probes in small animals. We integrated a critical enabling component, a complementary metal-oxide semiconductor (CMOS) read-out integrated circuit, which digitized the fluorescence signal to achieve autofluorescence-limited sensitivity. After surgical implantation of the lightweight sensor for two weeks, we obtained continuous and dynamic fluorophore measurements while the subject was un-anesthetized and mobile. The technology demonstrated here represents a critical step in the path toward untethered optical sensing using an integrated optoelectronic implant. PMID:24009996

  6. Real-time, continuous, fluorescence sensing in a freely-moving subject with an implanted hybrid VCSEL/CMOS biosensor.

    PubMed

    O'Sullivan, Thomas D; Heitz, Roxana T; Parashurama, Natesh; Barkin, David B; Wooley, Bruce A; Gambhir, Sanjiv S; Harris, James S; Levi, Ofer

    2013-01-01

    Performance improvements in instrumentation for optical imaging have contributed greatly to molecular imaging in living subjects. In order to advance molecular imaging in freely moving, untethered subjects, we designed a miniature vertical-cavity surface-emitting laser (VCSEL)-based biosensor measuring 1cm(3) and weighing 0.7g that accurately detects both fluorophore and tumor-targeted molecular probes in small animals. We integrated a critical enabling component, a complementary metal-oxide semiconductor (CMOS) read-out integrated circuit, which digitized the fluorescence signal to achieve autofluorescence-limited sensitivity. After surgical implantation of the lightweight sensor for two weeks, we obtained continuous and dynamic fluorophore measurements while the subject was un-anesthetized and mobile. The technology demonstrated here represents a critical step in the path toward untethered optical sensing using an integrated optoelectronic implant. PMID:24009996

  7. Top-down fabrication of fully CMOS-compatible silicon nanowire arrays and their integration into CMOS Inverters on plastic.

    PubMed

    Lee, Myeongwon; Jeon, Youngin; Moon, Taeho; Kim, Sangsig

    2011-04-26

    A route to the top-down fabrication of highly ordered and aligned silicon nanowire (SiNW) arrays with degenerately doped source/drain regions from a bulk Si wafer is presented. In this approach, freestanding n- and p-SiNWs with an inverted triangular cross section are obtained using conventional photolithography, crystal orientation dependent wet etching, size reduction oxidation, and ion implantation doping. Based on these n- and p-SiNWs transferred onto a plastic substrate, simple SiNW-based complementary metal-oxide-semiconductor (CMOS) inverters are constructed for the possible applications of these SiNW arrays in integrated circuits on plastic. The static voltage transfer characteristic of the SiNW-based CMOS inverter exhibits a voltage gain of ∼9 V/V and a transition of 0.32 V at an operating voltage of 1.5 V with a full output voltage swing between 0 V and V(DD), and its mechnical bendability indicates good fatigue properties for potential applications of flexible electronics. This novel top-down approach is fully compatible with the current state-of-the-art Si-based CMOS technologies and, therefore, offers greater flexibility in device design for both high-performance and low-power functionality. PMID:21355599

  8. Charge integration successive approximation analog-to-digital converter for focal plane applications using a single amplifier

    NASA Technical Reports Server (NTRS)

    Zhou, Zhimin (Inventor); Pain, Bedabrata (Inventor)

    1999-01-01

    An analog-to-digital converter for on-chip focal-plane image sensor applications. The analog-to-digital converter utilizes a single charge integrating amplifier in a charge balancing architecture to implement successive approximation analog-to-digital conversion. This design requires minimal chip area and has high speed and low power dissipation for operation in the 2-10 bit range. The invention is particularly well suited to CMOS on-chip applications requiring many analog-to-digital converters, such as column-parallel focal-plane architectures.

  9. Digital clubbing

    PubMed Central

    Sarkar, Malay; Mahesh, D. M.; Madabhavi, Irappa

    2012-01-01

    Digital clubbing is an ancient and important clinical signs in medicine. Although clubbed fingers are mostly asymptomatic, it often predicts the presence of some dreaded underlying diseases. Its exact pathogenesis is not known, but platelet-derived growth factor and vascular endothelial growth factor are recently incriminated in its causation. The association of digital clubbing with various disease processes and its clinical implications are discussed in this review. PMID:23243350

  10. Digital Epidemiology

    PubMed Central

    Salathé, Marcel; Bengtsson, Linus; Bodnar, Todd J.; Brewer, Devon D.; Brownstein, John S.; Buckee, Caroline; Campbell, Ellsworth M.; Cattuto, Ciro; Khandelwal, Shashank; Mabry, Patricia L.; Vespignani, Alessandro

    2012-01-01

    Mobile, social, real-time: the ongoing revolution in the way people communicate has given rise to a new kind of epidemiology. Digital data sources, when harnessed appropriately, can provide local and timely information about disease and health dynamics in populations around the world. The rapid, unprecedented increase in the availability of relevant data from various digital sources creates considerable technical and computational challenges. PMID:22844241

  11. Solid-state image sensor with focal-plane digital photon-counting pixel array

    NASA Technical Reports Server (NTRS)

    Fossum, Eric R. (Inventor); Pain, Bedabrata (Inventor)

    1995-01-01

    A photosensitive layer such as a-Si for a UV/visible wavelength band is provided for low light level imaging with at least a separate CMOS amplifier directly connected to each PIN photodetector diode to provide a focal-plane array of NxN pixels, and preferably a separate photon-counting CMOS circuit directly connected to each CMOS amplifier, although one row of counters may be time shared for reading out the photon flux rate of each diode in the array, together with a buffer memory for storing all rows of the NxN image frame before transfer to suitable storage. All CMOS circuitry is preferably fabricated in the same silicon layer as the PIN photodetector diode for a monolithic structure, but when the wavelength band of interest requires photosensitive material different from silicon, the focal-plane array may be fabricated separately on a different semiconductor layer bump-bonded or otherwise bonded for a virtually monolithic structure with one free terminal of each diode directly connected to the input terminal of its CMOS amplifier and digital counter for integration of the photon flux rate at each photodetector of the array.

  12. Ultra-high speed and low latency broadband digital video transport

    NASA Astrophysics Data System (ADS)

    Stufflebeam, Joseph L.; Remley, Dennis M.; Sullivan, Anthony; Gurrola, Hector

    2004-07-01

    Various approaches for transporting digital video over Ethernet and SONET networks are presented. Commercial analog and digital frame grabbers are utilized, as well as software running under Microsoft Windows 2000/XP. No other specialized hardware is required. A network configuration using independent VLANs for video channels provides efficient transport for high bandwidth data. A framework is described for implementing both uncompressed and compressed streaming with standard and non-standard video. NTSC video is handled as well as other formats that include high resolution CMOS, high bit-depth infrared, and high frame rate parallel digital. End-to-end latencies of less than 200 msec are achieved.

  13. Digital photography

    PubMed Central

    Windsor, J S; Rodway, G W; Middleton, P M; McCarthy, S

    2006-01-01

    Objective The emergence of a new generation of “point‐and‐shoot” digital cameras offers doctors a compact, portable and user‐friendly solution to the recording of highly detailed digital photographs and video images. This work highlights the use of such technology, and provides information for those who wish to record, store and display their own medical images. Methods Over a 3‐month period, a digital camera was carried by a doctor in a busy, adult emergency department and used to record a range of clinical images that were subsequently transferred to a computer database. Results In total, 493 digital images were recorded, of which 428 were photographs and 65 were video clips. These were successfully used for teaching purposes, publications and patient records. Conclusions This study highlights the importance of informed consent, the selection of a suitable package of digital technology and the role of basic photographic technique in developing a successful digital database in a busy clinical environment. PMID:17068281

  14. Digital radiography.

    PubMed

    Mattoon, J S

    2006-01-01

    Digital radiography has been used in human medical imaging since the 1980s with recent and rapid acceptance into the veterinary profession. Using advanced image capture and computer technology, radiographic images are viewed on a computer monitor. This is advantageous because radiographic images can be adjusted using dedicated computer software to maximize diagnostic image quality. Digital images can be accessed at computer workstations throughout the hospital, instantly retrieved from computer archives, and transmitted via the internet for consultation or case referral. Digital radiographic data can also be incorporated into a hospital information system, making record keeping an entirely paperless process. Digital image acquisition is faster when compared to conventional screen-film radiography, improving workflow and patient throughput. Digital radiography greatly reduces the need for 'retake' radiographs because of wide latitude in exposure factors. Also eliminated are costs associated with radiographic film and x-ray film development. Computed radiography, charged coupled devices, and flat panel detectors are types of digital radiography systems currently available. PMID:16971994

  15. Imaging performance of a thin Lu2O3:Eu nanophosphor scintillating screen coupled to a high resolution CMOS sensor under X-ray radiographic conditions: comparison with Gd2O2S:Eu conventional phosphor screen

    NASA Astrophysics Data System (ADS)

    Seferis, I.; Michail, C.; Valais, I.; Zeler, J.; Liaparinos, P.; Kalyvas, N.; Fountos, G.; Zych, E.; Kandarakis, I.; Panayiotakis, G.

    2014-03-01

    The purpose of the present study was to experimentally evaluate the imaging characteristics of the Lu2O3:Eu nanophosphor thin screen coupled to a high resolution CMOS sensor under radiographic conditions. Parameters such as the Modulation Transfer Function (MTF), the Normalized Noise Power Spectrum (NNPS) and the Detective Quantum Efficiency (DQE) were investigated at 70 kVp under three exposure levels (20 mAs, 63 mAs and 90 mAs). Since Lu2O3:Eu emits light in the red wavelength range, the imaging characteristics of a 33.3 mg/cm2 Gd2O2S:Eu conventional phosphor screen were also evaluated for comparison purposes. The Lu2O3:Eu nanophosphor powder was produced by the combustion synthesis, using urea as fuel. A scintillating screen of 30.2 mg/cm2 was prepared by sedimentation of the nanophosphor powder on a fused silica substrate. The CMOS/Lu2O3:Eu detector`s imaging characteristics were evaluated using an experimental method proposed by the International Electrotechnical Commission (IEC) guidelines. It was found that the CMOS/Lu2O3:Eu nanophosphor system has higher MTF values compared to the CMOS/Gd2O2S:Eu sensor/screen combination in the whole frequency range examined. For low frequencies (0 to 2 cycles/mm) NNPS values of the CMOS/Gd2O2S:Eu system were found 90% higher compared to the NNPS values of the CMOS/Lu2O3:Eu nanophosphor system, whereas from medium to high frequencies (2 to 13 cycles/mm) were found 40% higher. In contrast with the CMOS/ Gd2O2S:Eu system, CMOS/Lu2O3:Eu nanophosphor system appears to retain high DQE values in the whole frequency range examined. Our results indicate that Lu2O3:Eu nanophosphor is a promising scintillator for further research in digital X-ray radiography.

  16. Digital Collections, Digital Libraries & the Digitization of Cultural Heritage Information.

    ERIC Educational Resources Information Center

    Lynch, Clifford

    2002-01-01

    Discusses digital collections and digital libraries. Topics include broadband availability; digital rights protection; content, both non-profit and commercial; digitization of cultural content; sustainability; metadata harvesting protocol; infrastructure; authorship; linking multiple resources; data mining; digitization of reference works;…

  17. System on chip thermal vacuum sensor based on standard CMOS process

    NASA Astrophysics Data System (ADS)

    Jinfeng, Li; Zhen'an, Tang; Jiaqi, Wang

    2009-03-01

    An on-chip microelectromechanical system was fabricated in a 0.5 μm standard CMOS process for gas pressure detection. The sensor was based on a micro-hotplate (MHP) and had been integrated with a rail to rail operational amplifier and an 8-bit successive approximation register (SAR) A/D converter. A tungsten resistor was manufactured on the MHP as the sensing element, and the sacrificial layer of the sensor was made from polysilicon and etched by surface-micromachining technology. The operational amplifier was configured to make the sensor operate in constant current mode. A digital bit stream was provided as the system output. The measurement results demonstrate that the gas pressure sensitive range of the vacuum sensor extends from 1 to 105 Pa. In the gas pressure range from 1 to 100 Pa, the sensitivity of the sensor is 0.23 mV/ Pa, the linearity is 4.95%, and the hysteresis is 8.69%. The operational amplifier can drive 200 ω resistors distortionlessly, and the SAR A/D converter achieves a resolution of 7.4 bit with 100 kHz sample rate. The performance of the operational amplifier and the SAR A/D converter meets the requirements of the sensor system.

  18. Design of an Embedded CMOS Temperature Sensor for Passive RFID Tag Chips.

    PubMed

    Deng, Fangming; He, Yigang; Li, Bing; Zhang, Lihua; Wu, Xiang; Fu, Zhihui; Zuo, Lei

    2015-01-01

    This paper presents an ultra-low embedded power temperature sensor for passive RFID tags. The temperature sensor converts the temperature variation to a PTAT current, which is then transformed into a temperature-controlled frequency. A phase locked loop (PLL)-based sensor interface is employed to directly convert this temperature-controlled frequency into a corresponding digital output without an external reference clock. The fabricated sensor occupies an area of 0.021 mm2 using the TSMC 0.18 1P6M mixed-signal CMOS process. Measurement results of the embedded sensor within the tag system shows a 92 nW power dissipation under 1.0 V supply voltage at room temperature, with a sensing resolution of 0.15 °C/LSB and a sensing accuracy of -0.7/0.6 °C from -30 °C to 70 °C after 1-point calibration at 30 °C. PMID:25993518

  19. A SiGe BiCMOS multi-band tuner for mobile TV applications

    NASA Astrophysics Data System (ADS)

    Xueqing, Hu; Zheng, Gong; Jinxin, Zhao; Lei, Wang; Peng, Yu; Yin, Shi

    2012-04-01

    This paper presents the circuit design and measured performance of a multi-band tuner for mobile TV applications. The tuner RFIC is composed of a wideband front-end, an analog baseband, a full integrated fractional-N synthesizer and an I2C digital interface. To meet the stringent adjacent channel rejection (ACR) requirements of mobile TV standards while keeping low power consumption and low cost, direct conversion architecture with a local AGC scheme is adopted in this design. Eighth-order elliptic active-RC filters with large stop band attenuation and a sharp transition band are chosen as the channel select filter to further improve the ACR preference. The chip is fabricated in a 0.35-μm SiGe BiCMOS technology and occupies a silicon area of 5.5 mm2. It draws 50 mA current from a 3.0 V power supply. In CMMB application, it achieves a sensitivity of -97 dBm with 1/2 coding QPSK signal input and over 40 dB ACR.

  20. CMOS CFA database under varying illumination for benchmarking of face detection algorithms

    NASA Astrophysics Data System (ADS)

    Bocchio, Sara; Beverina, Fabrizio; Rosti, Alberto; Castelli, L.; Dominelli, S.

    2003-12-01

    In this paper we present a database containing human faces images, for benchmarking face detection algorithms. Face detection is one of the most critical steps for applications such as recognition, identification, and surveillance. We developed the database systematically, choosing a set of twenty subjects of different gender, performing more acquisitions for each one of them. All faces have different poses and expressions and various characteristics of haircut, beard and accessories. Complex backgrounds and noise conditions reflect the variability of a typical image capture in practical office applications. We performed also experiments of multi-face acquisition. All the subjects are acquired under different illuminants, such as incandescent and halogen lamps, to reproduce realistic indoor environments. The database is a color one, because most face location algorithms are based on skin location, which depends on color identification. For every picture the database contains the full color images in bitmap format and the Color Filter Array (CFA) images with the classic Bayer pattern. We also use this database as a test for our Coupled Metal Oxide Semiconductor (CMOS) sensor, to introduce low cost devices for digital color imaging acquisition and elaboration.

  1. High-speed laser Doppler perfusion imaging using an integrating CMOS image sensor.

    PubMed

    Serov, Alexandre; Lasser, Theo

    2005-08-22

    This paper describes the design and the performance of a new high-speed laser Doppler imaging system for monitoring blood flow over an area of tissue. The new imager delivers high-resolution flow images (256x256 pixels) every 2 to 10 seconds, depending on the number of points in the acquired time-domain signal (32-512 points). This new imaging modality utilizes a digital integrating CMOS image sensor to detect Doppler signals in a plurality of points over the area illuminated by a divergent laser beam of a uniform intensity profile. The integrating property of the detector improves the signal-to-noise ratio of the measurements, which results in high-quality flow images. We made a series of measurements in vitro to test the performance of the system in terms of bandwidth, SNR, etc. Subsequently we give some examples of flow-related images measured on human skin, thus demonstrating the performance of the imager in vivo. The perspectives for future implementations of the imager for clinical and physiological applications are discussed. PMID:19498655

  2. High Speed, Radiation Hard CMOS Pixel Sensors for Transmission Electron Microscopy

    NASA Astrophysics Data System (ADS)

    Contarato, Devis; Denes, Peter; Doering, Dionisio; Joseph, John; Krieger, Brad

    CMOS monolithic active pixel sensors are currently being established as the technology of choice for new generation digital imaging systems in Transmission Electron Microscopy (TEM). A careful sensor design that couples μm-level pixel pitches with high frame rate readout and radiation hardness to very high electron doses enables the fabrication of direct electron detectors that are quickly revolutionizing high-resolution TEM imaging in material science and molecular biology. This paper will review the principal characteristics of this novel technology and its advantages over conventional, optically-coupled cameras, and retrace the sensor development driven by the Transmission Electron Aberration corrected Microscope (TEAM) project at the LBNL National Center for Electron Microscopy (NCEM), illustrating in particular the imaging capabilities enabled by single electron detection at high frame rate. Further, the presentation will report on the translation of the TEAM technology to a finer feature size process, resulting in a sensor with higher spatial resolution and superior radiation tolerance currently serving as the baseline for a commercial camera system.

  3. Laser Doppler blood flow imaging with a 64×64 pixel full custom CMOS sensor

    NASA Astrophysics Data System (ADS)

    He, D.; Nguyen, H. C.; Hayes-Gill, B. R.; Zhu, Y.; Crowe, J. A.; Morgan, S. P.; Clough, G. F.; Gill, C. A.

    2011-03-01

    Full field laser Doppler perfusion imaging offers advantages over scanning laser Doppler imaging as the effects of movement artifacts are reduced. The increased frame rate allows rapid changes in blood flow to be imaged. A custom made CMOS sensor offers several advantages over commercial cameras as the design can be optimized to the detected signals. For example, laser Doppler signals are known to have a bandwidth from DC up to ~20KHz and be of a low modulation depth. Therefore a design that can amplify the AC component and have a sampling rate and an antialiasing filter appropriate to the signal bandwidth would be beneficial. An additional advantage of custom made sensors is that on-chip processing of blood flow allows the data bottleneck that exists between the photo-detector array and processing electronics to be overcome, as the processed data can be read out from the image sensor to a PC or display at a low data rate. A fully integrated 64x64 pixel array for imaging blood flow is presented. On-chip analog signal processing is used to amplify the AC component, normalize the AC signal by the DC light intensity and provide anti-aliasing. On-chip digital signal processing is used to implement the filters required to calculate blood flow. The imaging array has been incorporated into a device that has been used in a clinical setting. Results are presented demonstrating changes in blood flow in occlusion and release tests.

  4. Design of an Embedded CMOS Temperature Sensor for Passive RFID Tag Chips

    PubMed Central

    Deng, Fangming; He, Yigang; Li, Bing; Zhang, Lihua; Wu, Xiang; Fu, Zhihui; Zuo, Lei

    2015-01-01

    This paper presents an ultra-low embedded power temperature sensor for passive RFID tags. The temperature sensor converts the temperature variation to a PTAT current, which is then transformed into a temperature-controlled frequency. A phase locked loop (PLL)-based sensor interface is employed to directly convert this temperature-controlled frequency into a corresponding digital output without an external reference clock. The fabricated sensor occupies an area of 0.021 mm2 using the TSMC 0.18 1P6M mixed-signal CMOS process. Measurement results of the embedded sensor within the tag system shows a 92 nW power dissipation under 1.0 V supply voltage at room temperature, with a sensing resolution of 0.15 °C/LSB and a sensing accuracy of −0.7/0.6 °C from −30 °C to 70 °C after 1-point calibration at 30 °C. PMID:25993518

  5. Characterization of Si-PIN radiation detector with photon counting mode CMOS readout front-end

    NASA Astrophysics Data System (ADS)

    Jeon, Sungchae; Huh, Young; Jin, Seongoh; Park, Jongduk; Lee, Jae Yun; Kang, Bo Sun; Cho, Gyuseong

    2007-06-01

    An X-ray pixel detector with photon counting technique for digital X-ray imaging was designed and developed. Si detector was fabricated starting from 5 in., FZ-refined, 620 μm-thick, <1 1 1> oriented, n-typed silicon wafer with high resistivity of 6000-12,000 Ω cm. Readout front-end, which consists of the preamplifier, comparator, and bias circuits including the band-gap reference circuits, was designed and fabricated using 0.25 μm-triple-well CMOS standard process. In detector, the several types of guard-ring structures were tested. The biased p-type guard ring showed more reasonable results in the leakage current and breakdown voltage. The experimental results for the readout chip prove that its functionality is correctly operated up to 100 mV, 2.5 M events/s. In radiation experiment under irradiation of 60Co at dose rate 10 krad/h the measurement indicate that the band gap reference generator (BGR) circuits work up to 240 krad and the maximum variation of output voltage is 0.4% (peak-to-peak) of operational voltage at the range of 0-240 krad. It cannot lead to any critical problem for use in its operation.

  6. Advanced monolithic active pixel sensors for tracking, vertexing and calorimetry with full CMOS capability

    NASA Astrophysics Data System (ADS)

    Stanitzki, M.; SPiDeR Collaboration, www. spider. ac. uk

    2011-09-01

    We present test results from the "TPAC" and "F ORTIS" sensors produced using the 180 nm CMOS INMAPS process. The TPAC sensor has a 50 μm pixel size with advanced in-pixel electronics. Although TPAC was developed for digital electromagnetic calorimetry, the technology can be readily extended to tracking and vertexing applications where highly granular pixels with in-pixel intelligence are required. By way of example, a variant of the TPAC sensor has been proposed for the Super B vertex detector. The F ORTIS sensor is a prototype with several pixel variants to study the performance of a four transistors (4T) architecture and is the first sensor of this type tested for particle physics applications. TPAC and F ORTIS sensors have been fabricated with some of the processing innovations available in INMAPS such as deep p-wells and high-resistivity epitaxial layers. The performance of these sensor variants has been measured both in the laboratory and at test beams and results showing significant improvements due to these innovations are presented. We have recently manufactured the "C HERWELL" sensor, building on the experience with both TPAC and F ORTIS and making use of the 4T approach. C HERWELL is designed for tracking and vertexing and has an integrated ADC and targets very low-noise performance. The principal features of C HERWELL are described.

  7. Characterization of a Tissue-Equivalent Dosimeter based on CMOS Solid-State Photomultipliers

    NASA Astrophysics Data System (ADS)

    Johnson, Erik; Benton, Eric; Stapels, Christopher; Chrsitian, James; Jie Chen, Xiao

    Available digital dosimeters are bulky and unable to provide real-time monitoring of dose from space radiation. The complexity of space-flight design requires reliable, fault-tolerant equip-ment capable of providing real-time dosimetry during a mission, which is not feasible with the existing thermoluminescent dosimeter (TLD) technology, especially during extravehicular activity (EVA). Real-time monitoring is important for low-Earth orbiting spacecraft and inter-planetary space flight to alert the crew when Solar Particle Events (SPE) increase the particle flux of the spacecraft environment. A dosimeter-on-a-chip for personal dosimetry is comprised of a tissue-equivalent scintillator coupled to a solid-state photomultiplier (SSPM) built using CMOS technology. The radiation sensitive component of the dosimeter is coupled to analog signal processing components and a microprocessor, which can maintain processing fidelity up to 5x105 events per second. The dynamic range of the dosimeter has been verified from 1-GeV protons (0.22 keV/µm in H20) to 420 MeV/n Fe (201.1 keV/µm in H20). The dosimeter confirmed doses to within 3

  8. Optical and x-ray characterization of two novel CMOS image sensors

    NASA Astrophysics Data System (ADS)

    Bohndiek, Sarah E.; Arvanitis, Costas D.; Venanzi, Cristian; Royle, Gary J.; Clark, Andy T.; Crooks, Jamie P.; Prydderch, Mark L.; Turchetta, Renato; Blue, Andrew; Speller, Robert D.

    2007-02-01

    A UK consortium (MI3) has been founded to develop advanced CMOS pixel designs for scientific applications. Vanilla, a 520x520 array of 25μm pixels benefits from flushed reset circuitry for low noise and random pixel access for region of interest (ROI) readout. OPIC, a 64x72 test structure array of 30μm digital pixels has thresholding capabilities for sparse readout at 3,700fps. Characterization is performed with both optical illumination and x-ray exposure via a scintillator. Vanilla exhibits 34+/-3e - read noise, interactive quantum efficiency of 54% at 500nm and can read a 6x6 ROI at 24,395fps. OPIC has 46+/-3e - read noise and a wide dynamic range of 65dB due to high full well capacity. Based on these characterization studies, Vanilla could be utilized in applications where demands include high spectral response and high speed region of interest readout while OPIC could be used for high speed, high dynamic range imaging.

  9. Multisite monitoring of choline using biosensor microprobe arrays in combination with CMOS circuitry.

    PubMed

    Frey, Olivier; Rothe, Jörg; Heer, Flavio; van der Wal, Peter D; de Rooij, Nico F; Hierlemann, Andreas

    2014-08-01

    A miniature device enabling parallel in vivo detection of the neurotransmitter choline in multiple brain regions of freely behaving rodents is presented. This is achieved by combining a biosensor microprobe array with a custom-developed CMOS chip. Each silicon microprobe comprises multiple platinum electrodes that are coated with an enzymatic membrane and a permselective layer for selective detection of choline. The biosensors, based on the principle of amperometric detection, exhibit a sensitivity of 157±35 µA mM(-1) cm(-2), a limit of detection of below 1 µM, and a response time in the range of 1 s. With on-chip digitalization and multiplexing, parallel recordings can be performed at a high signal-to-noise ratio with minimal space requirements and with substantial reduction of external signal interference. The layout of the integrated circuitry allows for versatile configuration of the current range and can, therefore, also be used for functionalization of the electrodes before use. The result is a compact, highly integrated system, very convenient for on-site measurements. PMID:24145056

  10. Using high frame rate CMOS sensors for three-dimensional eye tracking.

    PubMed

    Clarke, A H; Ditterich, J; Drüen, K; Schönfeld, U; Steineke, C

    2002-11-01

    A novel three-dimensional eye tracker is described and its performance evaluated. In contrast to previous devices based on conventional video standards, the present eye tracker is based on programmable CMOS image sensors, interfaced directly to digital processing circuitry to permit real-time image acquisition and processing. This architecture provides a number of important advantages, including image sampling rates of up to 400/sec measurement, direct pixel addressing for preprocessing and acquisition,and hard-disk storage of relevant image data. The reconfigurable digital processing circuitry also facilitates inline optmization of the front-end, time-critical processes. The primary acquisition algorithm for tracking the pupil and other eye features is designed around the generalized Hough transform. The tracker permits comprehensive measurement of eye movement (three degrees of freedom) and head movement (six degrees of freedom), and thus provides the basis for many types of vestibulo-oculomotor and visual research. The device has been qualified by the German Space Agency (DLR) and NASA for deployment on the International Space Station. It is foreseen that the device will be used together with appropriate stimulus generators as a general purpose facility for visual and vestibular experiments. Initial verification studies with an artificial eye demonstrate a measurement resolution of better than 0.1 degrees in all three components (i.e.,system noise for each of the components measured as 0.006 degrees H, 0.005 degrees V, and 0.016 degrees T. Over a range of +/-20 degrees eye rotation, linearity was found to be <0.5% (H), <0.5% (V), and <2.0% (T). A comparison with the scleral search coil technique yielded near equivalent values for the system noise and the thickness of Listing's plane. PMID:12564559

  11. Architecture for a 1-GHz Digital RADAR

    NASA Technical Reports Server (NTRS)

    Mallik, Udayan

    2011-01-01

    An architecture for a Direct RF-digitization Type Digital Mode RADAR was developed at GSFC in 2008. Two variations of a basic architecture were developed for use on RADAR imaging missions using aircraft and spacecraft. Both systems can operate with a pulse repetition rate up to 10 MHz with 8 received RF samples per pulse repetition interval, or at up to 19 kHz with 4K received RF samples per pulse repetition interval. The first design describes a computer architecture for a Continuous Mode RADAR transceiver with a real-time signal processing and display architecture. The architecture can operate at a high pulse repetition rate without interruption for an infinite amount of time. The second design describes a smaller and less costly burst mode RADAR that can transceive high pulse repetition rate RF signals without interruption for up to 37 seconds. The burst-mode RADAR was designed to operate on an off-line signal processing paradigm. The temporal distribution of RF samples acquired and reported to the RADAR processor remains uniform and free of distortion in both proposed architectures. The majority of the RADAR's electronics is implemented in digital CMOS (complementary metal oxide semiconductor), and analog circuits are restricted to signal amplification operations and analog to digital conversion. An implementation of the proposed systems will create a 1-GHz, Direct RF-digitization Type, L-Band Digital RADAR--the highest band achievable for Nyquist Rate, Direct RF-digitization Systems that do not implement an electronic IF downsample stage (after the receiver signal amplification stage), using commercially available off-the-shelf integrated circuits.

  12. Dynamic SVL and body bias for low leakage power and high performance in CMOS digital circuits

    NASA Astrophysics Data System (ADS)

    Deshmukh, Jyoti; Khare, Kavita

    2012-12-01

    In this article, a new complementary metal oxide semiconductor design scheme called dynamic self-controllable voltage level (DSVL) is proposed. In the proposed scheme, leakage power is controlled by dynamically disconnecting supply to inactive blocks and adjusting body bias to further limit leakage and to maintain performance. Leakage power measurements at 1.8 V, 75°C demonstrate power reduction by 59.4% in case of 1 bit full adder and by 43.0% in case of a chain of four inverters using SVL circuit as a power switch. Furthermore, we achieve leakage power reduction by 94.7% in case of 1 bit full adder and by 91.8% in case of a chain of four inverters using dynamic body bias. The forward body bias of 0.45 V applied in active mode improves the maximum operating frequency by 16% in case of 1 bit full adder and 5.55% in case of a chain of inverters. Analysis shows that additional benefits of using the DSVL and body bias include high performance, low leakage power consumption in sleep mode, single threshold implementation and state retention even in standby mode.

  13. Stitched large format CMOS image sensors for dental x-ray digital radiography

    NASA Astrophysics Data System (ADS)

    Liu, Xinqiao (Chiao); Fowler, Boyd; Do, Hung; Jaffe, Mark; Rassel, Richard; Leidy, Bob

    2012-10-01

    In this paper, we present a family of large format CIS's designed for dental x-ray applications. The CIS areas vary from small 31.5mm x 20.1mm, to medium 34.1mm x 26.3mm, to large 37.1mm x 26.3mm. Pixel size is 19.5um x 19.5um. The sensor family was fabricated in a 0.18um CIS process. Stitching is used in the CIS fabrication for the medium and large size sensors. We present the CIS and detector system design that includes pixel circuitry, readout circuitry, x-ray trigger mechanism, scintillator, and the camera electronics. We also present characterization results including the detector performances under both visible light and x-ray radiation.

  14. Swap intensified WDR CMOS module for I2/LWIR fusion

    NASA Astrophysics Data System (ADS)

    Ni, Yang; Noguier, Vincent

    2015-05-01

    The combination of high resolution visible-near-infrared low light sensor and moderate resolution uncooled thermal sensor provides an efficient way for multi-task night vision. Tremendous progress has been made on uncooled thermal sensors (a-Si, VOx, etc.). It's possible to make a miniature uncooled thermal camera module in a tiny 1cm3 cube with <1W power consumption. For silicon based solid-state low light CCD/CMOS sensors have observed also a constant progress in terms of readout noise, dark current, resolution and frame rate. In contrast to thermal sensing which is intrinsic day&night operational, the silicon based solid-state sensors are not yet capable to do the night vision performance required by defense and critical surveillance applications. Readout noise, dark current are 2 major obstacles. The low dynamic range at high sensitivity mode of silicon sensors is also an important limiting factor, which leads to recognition failure due to local or global saturations & blooming. In this context, the image intensifier based solution is still attractive for the following reasons: 1) high gain and ultra-low dark current; 2) wide dynamic range and 3) ultra-low power consumption. With high electron gain and ultra low dark current of image intensifier, the only requirement on the silicon image pickup device are resolution, dynamic range and power consumption. In this paper, we present a SWAP intensified Wide Dynamic Range CMOS module for night vision applications, especially for I2/LWIR fusion. This module is based on a dedicated CMOS image sensor using solar-cell mode photodiode logarithmic pixel design which covers a huge dynamic range (> 140dB) without saturation and blooming. The ultra-wide dynamic range image from this new generation logarithmic sensor can be used directly without any image processing and provide an instant light accommodation. The complete module is slightly bigger than a simple ANVIS format I2 tube with <500mW power consumption.

  15. SOI CMOS Imager with Suppression of Cross-Talk

    NASA Technical Reports Server (NTRS)

    Pain, Bedabrata; Zheng, Xingyu; Cunningham, Thomas J.; Seshadri, Suresh; Sun, Chao

    2009-01-01

    A monolithic silicon-on-insulator (SOI) complementary metal oxide/semiconductor (CMOS) image-detecting integrated circuit of the active-pixel-sensor type, now undergoing development, is designed to operate at visible and near-infrared wavelengths and to offer a combination of high quantum efficiency and low diffusion and capacitive cross-talk among pixels. The imager is designed to be especially suitable for astronomical and astrophysical applications. The imager design could also readily be adapted to general scientific, biological, medical, and spectroscopic applications. One of the conditions needed to ensure both high quantum efficiency and low diffusion cross-talk is a relatively high reverse bias potential (between about 20 and about 50 V) on the photodiode in each pixel. Heretofore, a major obstacle to realization of this condition in a monolithic integrated circuit has been posed by the fact that the required high reverse bias on the photodiode is incompatible with metal oxide/semiconductor field-effect transistors (MOSFETs) in the CMOS pixel readout circuitry. In the imager now being developed, the SOI structure is utilized to overcome this obstacle: The handle wafer is retained and the photodiode is formed in the handle wafer. The MOSFETs are formed on the SOI layer, which is separated from the handle wafer by a buried oxide layer. The electrical isolation provided by the buried oxide layer makes it possible to bias the MOSFETs at CMOS-compatible potentials (between 0 and 3 V), while biasing the photodiode at the required higher potential, and enables independent optimization of the sensory and readout portions of the imager.

  16. A CMOS In-Pixel CTIA High Sensitivity Fluorescence Imager

    PubMed Central

    Murari, Kartikeya; Etienne-Cummings, Ralph; Thakor, Nitish; Cauwenberghs, Gert

    2012-01-01

    Traditionally, charge coupled device (CCD) based image sensors have held sway over the field of biomedical imaging. Complementary metal oxide semiconductor (CMOS) based imagers so far lack sensitivity leading to poor low-light imaging. Certain applications including our work on animal-mountable systems for imaging in awake and unrestrained rodents require the high sensitivity and image quality of CCDs and the low power consumption, flexibility and compactness of CMOS imagers. We present a 132×124 high sensitivity imager array with a 20.1 μm pixel pitch fabricated in a standard 0.5 μ CMOS process. The chip incorporates n-well/p-sub photodiodes, capacitive transimpedance amplifier (CTIA) based in-pixel amplification, pixel scanners and delta differencing circuits. The 5-transistor all-nMOS pixel interfaces with peripheral pMOS transistors for column-parallel CTIA. At 70 fps, the array has a minimum detectable signal of 4 nW/cm2 at a wavelength of 450 nm while consuming 718 μA from a 3.3 V supply. Peak signal to noise ratio (SNR) was 44 dB at an incident intensity of 1 μW/cm2. Implementing 4×4 binning allowed the frame rate to be increased to 675 fps. Alternately, sensitivity could be increased to detect about 0.8 nW/cm2 while maintaining 70 fps. The chip was used to image single cell fluorescence at 28 fps with an average SNR of 32 dB. For comparison, a cooled CCD camera imaged the same cell at 20 fps with an average SNR of 33.2 dB under the same illumination while consuming over a watt. PMID:23136624

  17. 77 FR 74513 - Certain CMOS Image Sensors and Products Containing Same; Investigations: Terminations...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-12-14

    ... (``CalTech''). 77 FR 33488 (June 6, 2012). The complaint alleged violations of section 337 of the Tariff... COMMISSION Certain CMOS Image Sensors and Products Containing Same; Investigations: Terminations... importation, and the sale within the United States after importation of certain CMOS image sensors...

  18. 77 FR 33488 - Certain CMOS Image Sensors and Products Containing Same; Institution of Investigation Pursuant to...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-06-06

    ... COMMISSION Certain CMOS Image Sensors and Products Containing Same; Institution of Investigation Pursuant to... States after importation of certain CMOS image sensors and products containing same by reason of... image sensors and products containing same that infringe one or more of claims 1 and 2 of the...

  19. CMOS IC fault models, physical defect coverage, and I sub DDQ testing

    SciTech Connect

    Fritzemeier, R.R.; Soden, J.M. ); Hawkins, C.F. . Dept. of Electrical and Computer Engineering)

    1991-01-01

    The development of the stuck-at fault (SAF) model is reviewed with emphasis on its relationship to CMOS integrated circuit (IC) technologies. The ability of the SAF model to represent common physical defects in CMOS ICs is evaluated. A test strategy for defect detection, which includes I{sub DDQ} testing is presented. 16 refs., 4 figs.

  20. Comparison of Total Dose Effects on Micropower Op-Amps: Bipolar and CMOS

    NASA Technical Reports Server (NTRS)

    Lee, C.; Johnston, A.

    1998-01-01

    This paper compares low-paper op-amps, OPA241 (bipolar) and OPA336 (CMOS), from Burr-Brown, MAX473 (bipolar) and MAX409 (CMOS), characterizing their total dose response with a single 2.7V power supply voltage.