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Sample records for afm cantilever tip

  1. Effect of tip mass on frequency response and sensitivity of AFM cantilever in liquid.

    PubMed

    Farokh Payam, Amir; Fathipour, Morteza

    2015-03-01

    The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) cantilever in the liquid environment is investigated. For this purpose, using Euler-Bernoulli beam theory and considering tip mass and hydrodynamic functions in a liquid environment, an expression for the resonance frequencies of AFM cantilever in liquid is derived. Then, based on this expression, the effect of the surface contact stiffness on the flexural mode of a rectangular AFM cantilever in fluid is investigated and compared with the case where the AFM cantilever operates in the air. The results show that in contrast with an air environment, the tip mass has no significant impact on the resonance frequency and sensitivity of the AFM cantilever in the liquid. Hence, analysis of AFM behaviour in liquid environment by neglecting the tip mass is logical. PMID:25562584

  2. Insight into mechanics of AFM tip-based nanomachining: bending of cantilevers and machined grooves.

    PubMed

    Al-Musawi, R S J; Brousseau, E B; Geng, Y; Borodich, F M

    2016-09-23

    Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study describes an important phenomenon specific for AFM nanomachining in the forward direction: under certain processing conditions, the deformed shape of the cantilever probe may change from a convex to a concave orientation. The phenomenon can principally change the depth and width of grooves machined, e.g. the grooves machined on a single crystal copper specimen may increase by 50% on average following such a change in the deformed shape of the cantilever. It is argued that this phenomenon can take place even when the AFM-based tool is operated in the so-called force-controlled mode. The study involves the refined theoretical analysis of cantilever probe bending, the analysis of experimental signals monitored during the backward and forward AFM tip-based machining and the inspection of the topography of produced grooves. PMID:27532247

  3. Effective AFM cantilever tip size: methods for in-situ determination

    NASA Astrophysics Data System (ADS)

    Maragliano, Carlo; Glia, Ayoub; Stefancich, Marco; Chiesa, Matteo

    2015-01-01

    In atomic force microscopy (AFM) investigations, knowledge of the cantilever tip radius R is essential for the quantitative interpretation of experimental observables. Here we propose two techniques to rapidly quantify in-situ the effective tip radius of AFM probes. The first method is based on the strong dependency of the minimum value of the free amplitude required to observe a sharp transition from attractive to repulsive force regimes on the AFM probe radius. Specifically, the sharper the tip, the smaller the value of free amplitude required to observe such a transition. The key trait of the second method is to treat the tip-sample system as a capacitor. Provided with an analytical model that takes into account the geometry of the tip-sample’s capacitance, one can quantify the effective size of the tip apex fitting the experimental capacitance versus distance curve. Flowchart-like algorithms, easily implementable on any hardware, are provided for both methods, giving a guideline to AFM practitioners. The methods’ robustness is assessed over a wide range of probes of different tip radii R (i.e. 4 < R < 50 nm) and geometries. Results obtained from both methods are compared with the nominal values given by manufacturers and verified by acquiring scanning electron microscopy images. Our observations show that while both methods are reliable and robust over the range of tip sizes tested, the critical amplitude method is more accurate for relatively sharp tips (4 nm < R < 10 nm).

  4. Fabrication of an electrochemical tip-probe system embedded in SiNx cantilevers for simultaneous SECM and AFM analysis

    NASA Astrophysics Data System (ADS)

    Fasching, Rainer J.; Tao, Yao; Prinz, Fritz B.

    2004-01-01

    An electrochemical transducer system embedded in silicon nitride cantilevers has been fabricated for simultaneous Scanning Electrochemical Microscopy (SECM) and Atomic Force Microscopy (AFM) analysis. Sharpened high-aspect ratio silicon tips are shaped combining isotropic and anisotropic deep-reactive etch processes and form the body of the transducer. Deposition of a silicon nitride followed by a back-etch step allows embedding these silicon tips in a silicon nitride layer so that they protrude through the nitride. This way, embedded silicon tips with a diameter smaller than 600 nm, a radius smaller than 50 nm, and an aspect ratio higher than 20 can be achieved. Subsequently, a platinum layer and an insulator layer are deposited on these tip structures. Introducing a metal masking technology utilizing Focused Ion Beam (FIB) technology, a precise exposure of the buried metal layer can be achieved to form ultra-micro electrodes on top of the tip. Finally, cantilever structures are shaped and released by etching the silicon substrate from the backside. Electrochemical and impedance spectroscopic characterization show electrochemical functionality of the transducer system. Due to the high aspect ratio topography of the tip structure and low spring constant of silicon nitride cantilevers, these probes are particularly suited for high resolution SECM and AFM analysis. Furthermore, this technology allows a production of both linear probe-arrays and two-dimensional probe-arrays.

  5. Cantilevers and tips for atomic force microscopy.

    PubMed

    Tortonese, M

    1997-01-01

    The cantilever and the tip are at the centerpiece of the AFM. Properties such as the cantilever stiffness and resonant frequency, tip shape and sharpness, and material characteristics determine the mode of operation of the AFM and the type of experiments and measurements that can be performed. The possibility of batch fabricating cantilevers has permitted the fabrication and characterization of specialized tips for a variety of experiments. We believe that the use of new materials and tip shapes will allow new applications for the AFM in the future. PMID:9086369

  6. Characterization of the interaction between AFM tips and surface nanobubbles.

    PubMed

    Walczyk, Wiktoria; Schönherr, Holger

    2014-06-24

    While the presence of gaseous enclosures observed at various solid-water interfaces, the so-called "surface nanobubles", has been confirmed by many groups in recent years, their formation, properties, and stability have not been convincingly and exhaustively explained. Here we report on an atomic force microscopy (AFM) study of argon nanobubbles on highly oriented pyrolitic graphite (HOPG) in water to elucidate the properties of nanobubble surfaces and the mechanism of AFM tip-nanobubble interaction. In particular, the deformation of the nanobubble-water interface by the AFM tip and the question whether the AFM tip penetrates the nanobubble during scanning were addressed by this combined intermittent contact (tapping) mode and force volume AFM study. We found that the stiffness of nanobubbles was smaller than the cantilever spring constant and comparable with the surface tension of water. The interaction with the AFM tip resulted in severe quasi-linear deformation of the bubbles; however, in the case of tip-bubble attraction, the interface deformed toward the tip. We tested two models of tip-bubble interaction, namely, the capillary force and the dynamic interaction model, and found, depending on the tip properties, good agreement with experimental data. The results showed that the tip-bubble interaction strength and the magnitude of the bubble deformation depend strongly on tip and bubble geometry and on tip and substrate material, and are very sensitive to the presence of contaminations that alter the interfacial tension. In particular, nanobubbles interacted differently with hydrophilic and hydrophobic AFM tips, which resulted in qualitatively and quantitatively different force curves measured on the bubbles in the experiments. To minimize bubble deformation and obtain reliable AFM results, nanobubbles must be measured with a sharp hydrophilic tip and with a cantilever having a very low spring constant in a contamination-free system. PMID:24856074

  7. Wedged AFM-cantilevers for parallel plate cell mechanics.

    PubMed

    Stewart, Martin P; Hodel, Adrian W; Spielhofer, Andreas; Cattin, Cedric J; Müller, Daniel J; Helenius, Jonne

    2013-04-01

    The combination of atomic force microscopy (AFM) and optical microscopy has gained popularity for mechanical analysis of living cells. In particular, recent AFM-based assays featuring tipless cantilevers and whole-cell deformation have yielded insights into cellular function, structure, and dynamics. However, in these assays the standard ≈10° tilt of the cantilever prevents uniaxial loading, which complicates assessment of cellular geometry and can cause cell sliding or loss of loosely adherent cells. Here, we describe an approach to modify tipless cantilevers with wedges and, thereby, achieve proper parallel plate mechanics. We provide guidance on material selection, the wedge production process, property and geometry assessment, and the calibration of wedged cantilevers. Furthermore, we demonstrate their ability to simplify the assessment of cell shape, prevent lateral displacement of round cells during compression, and improve the assessment of cell mechanical properties. PMID:23473778

  8. An approach towards 3D sensitive AFM cantilevers

    NASA Astrophysics Data System (ADS)

    Koops, Richard; Fokkema, Vincent

    2014-04-01

    The atomic force microscope (AFM) tapping mode is a highly sensitive local probing technique that is very useful to study and measure surface properties down to the atomic scale. The tapping mode is mostly implemented using the resonance of the first bending mode of the cantilever and therefore provides sensitivity mainly along the direction of this oscillation. Driven by the semiconductor industry, there is an increasing need for accurate measurements of nanoscale structures for side wall characterization by AFM that requires additional sensitivity in the lateral direction. The conventional tapping mode has been augmented by various authors, for example by tilting the cantilever system (Cho et al 2011 Rev. Sci. Instrum. 82 023707) to access the sidewall or using a torsion mode (Dai et al 2011 Meas. Sci. Technol. 22 094009) of the cantilever to provide additional lateral sensitivity. These approaches however trade lateral sensitivity for vertical sensitivity or still lack sensitivity in the remaining lateral direction. We present an approach towards true 3D sensitivity for AFM cantilevers based on simultaneous excitation and optical detection of multiple cantilever resonance modes along three axes. Tuning the excitation of the cantilever to specific frequencies provides a mechanism to select only those cantilever modes that have the desired characteristics. Additionally, cantilever engineering has been used to design and create a substructure within the cantilever that has been optimized for specific resonance behavior around 4 MHz. In contrast to the conventional approach of using a piezo to actuate the cantilever modulation, we present results on photo-thermal excitation using an intensity modulated low-power laser source. By tightly focusing the excitation spot on the cantilever we were able to attain a deflection efficiency of 0.7 nm µW-1 for the first bending mode. The presented approach results in an efficient all optical excitation and deflection detection

  9. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.

    PubMed

    Killgore, Jason P; Tung, Ryan C; Hurley, Donna C

    2014-08-29

    Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties, such as contact resonance force microscopy, creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an atomic force microscope cantilever's vibrational modes, it is essential to understand how the vibrations of the U-shaped HT-AFM cantilever differ from those of a more traditional rectangular lever, for which analytical techniques are better developed. Here we show, with a combination of finite element analysis (FEA) and experiments, that the HT-AFM cantilever exhibits many more readily-excited vibrational modes over typical AFM frequencies compared to a rectangular cantilever. The arms of U-shaped HT-AFM cantilevers exhibit two distinct forms of flexural vibrations that differ depending on whether the two arms are vibrating in-phase or out-of-phase with one another. The in-phase vibrations are qualitatively similar to flexural vibrations in rectangular cantilevers and generally show larger sensitivity to surface stiffness changes than the out-of-phase vibrations. Vibration types can be identified from their frequency and by considering vibration amplitudes in the horizontal and vertical channels of the AFM at different laser spot positions on the cantilever. For identifying contact resonance vibrational modes, we also consider the sensitivity of the resonant frequencies to a change in applied force and hence to tip-sample contact stiffness. Finally, we assess how existing analytical models can be used to accurately predict contact stiffness from contact-resonance HT-AFM results. A simple two-parameter Euler-Bernoulli beam model provided good agreement with FEA for in-phase modes up to a contact stiffness 500 times the cantilever spring constant. By providing insight into cantilever vibrations and exploring the potential of current analysis techniques, our results lay the groundwork

  10. Lateral tip control effects in CD-AFM metrology: the large tip limit

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald; Goldband, Ryan S.; Orji, Ndubuisi G.

    2015-10-01

    Critical dimension atomic force microscopes (CD-AFMs) use flared tips and two-dimensional sensing and control of the tip-sample interaction to enable scanning of features with near-vertical or even reentrant sidewalls. Sidewall sensing in CD-AFM usually involves lateral dither of the tip, which was the case in the first two generations of instruments. Current, third generation instruments also utilize a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM) probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. We have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To further validate our prior conclusions about the dependence of effective tip width on lateral stiffness, we recently performed experiments using a very large non-CD tip with an etched plateau of approximately 2 μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm/V is the baseline response due to the induced motion of the cantilever base.

  11. SU-8 hollow cantilevers for AFM cell adhesion studies

    NASA Astrophysics Data System (ADS)

    Martinez, Vincent; Behr, Pascal; Drechsler, Ute; Polesel-Maris, Jérôme; Potthoff, Eva; Vörös, Janos; Zambelli, Tomaso

    2016-05-01

    A novel fabrication method was established to produce flexible, transparent, and robust tipless hollow atomic force microscopy (AFM) cantilevers made entirely from SU-8. Channels of 3 μm thickness and several millimeters length were integrated into 12 μm thick and 40 μm wide cantilevers. Connected to a pressure controller, the devices showed high sealing performance with no leakage up to 6 bars. Changing the cantilever lengths from 100 μm to 500 μm among the same wafer allowed the targeting of various spring constants ranging from 0.5 to 80 N m‑1 within a single fabrication run. These hollow polymeric AFM cantilevers were operated in the optical beam deflection configuration. To demonstrate the performance of the device, single-cell force spectroscopy experiments were performed with a single probe detaching in a serial protocol more than 100 Saccharomyces cerevisiae yeast cells from plain glass and glass coated with polydopamine while measuring adhesion forces in the sub-nanoNewton range. SU-8 now offers a new alternative to conventional silicon-based hollow cantilevers with more flexibility in terms of complex geometric design and surface chemistry modification.

  12. Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

    PubMed Central

    Dixson, Ronald G.; Orji, Ndubuisi G.; Goldband, Ryan S.

    2016-01-01

    Sidewall sensing in critical dimension atomic force microscopes (CD-AFMs) usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM) probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. Understanding the influence and dependence of the effective tip width on the dither settings and lateral stiffness of the tip can improve the measurement accuracy and uncertainty estimation for CD-AFM measurements. Since CD-AFM typically uses tips that range from 15 nm to 850 nm in geometrical width, the behavior of effective tip width throughout this range should be understood. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. For tip widths of 130 nm and lower, which also have lower lateral stiffness, the response of the effective tip width to lateral dither is greater than for larger tips. However, we have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To validate that our prior conclusions about the dependence of effective tip width on lateral stiffness are valid for large CD-tips, we recently performed experiments using a very large non-CD tip with an etched plateau of approximately 2 μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm

  13. Analysis of AFM cantilever dynamics close to sample surface

    NASA Astrophysics Data System (ADS)

    Habibnejad Korayem, A.; Habibnejad Korayem, Moharam; Ghaderi, Reza

    2013-07-01

    For imaging and manipulation of biological specimens application of atomic force microscopy (AFM) in liquid is necessary. In this paper, tapping-mode AFM cantilever dynamics in liquid close to sample surface is modeled and simulated by well defining the contact forces. The effect of cantilever tilting angle has been accounted carefully. Contact forces have some differences in liquid in comparison to air or vacuum in magnitude or formulation. Hydrodynamic forces are also applied on the cantilever due to the motion in liquid. A continuous beam model is used with its first mode and forward-time simulation method for simulation of its hybrid dynamics and the frequency response and amplitude versus separation diagrams are extracted. The simulation results show a good agreement with experimental results. The resonance frequency in liquid is so small in comparison to air due to additional mass and also additional damping due to the viscosity of the liquid around. The results show that the effect of separation on free vibration amplitude is great. Its effect on resonance frequency is considerable too.

  14. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.

    PubMed

    Slattery, Ashley D; Blanch, Adam J; Quinton, Jamie S; Gibson, Christopher T

    2013-08-01

    Considerable attention has been given to the calibration of AFM cantilever spring constants in the last 20 years. Techniques that do not require tip-sample contact are considered advantageous since the imaging tip is not at risk of being damaged. Far less attention has been directed toward measuring the cantilever deflection or sensitivity, despite the fact that the primary means of determining this factor relies on the AFM tip being pressed against a hard surface, such as silicon or sapphire; which has the potential to significantly damage the tip. A recent method developed by Tourek et al. in 2010 involves deflecting the AFM cantilever a known distance from the imaging tip by pressing the cantilever against a sharpened tungsten wire. In this work a similar yet more precise method is described, whereby the deflection of the cantilever is achieved using an AFM probe with a spring constant much larger than the test cantilever, essentially a rigid cantilever. The exact position of loading on the test cantilever was determined by reverse AFM imaging small spatial markers that are milled into the test cantilever using a focussed ion beam. For V shaped cantilevers it is possible to reverse image the arm intersection in order to determine the exact loading point without necessarily requiring FIB milled spatial markers, albeit at the potential cost of additional uncertainty. The technique is applied to tip-less, beam shaped and V shaped cantilevers and compared to the hard surface contact technique with very good agreement (on average less than 5% difference). While the agreement with the hard surface contact technique was very good the error on the technique is dependent upon the assumptions inherent in the method, such as cantilever shape, loading point distance and ratio of test to rigid cantilever spring constants. The average error ranged between 2 to 5% for the majority of test cantilevers studied. The sensitivity derived with this technique can then be used to

  15. Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires

    DOEpatents

    Lee, James Weifu; Lowndes, Douglas H.; Merkulov, Vladimir I.; Eres, Gyula; Wei, Yayi; Greenbaum, Elias; Lee, Ida

    2004-06-29

    A method is described for catalyst-induced growth of carbon nanotubes, nanofibers, and other nanostructures on the tips of nanowires, cantilevers, conductive micro/nanometer structures, wafers and the like. The method can be used for production of carbon nanotube-anchored cantilevers that can significantly improve the performance of scaning probe microscopy (AFM, EFM etc). The invention can also be used in many other processes of micro and/or nanofabrication with carbon nanotubes/fibers. Key elements of this invention include: (1) Proper selection of a metal catalyst and programmable pulsed electrolytic deposition of the desired specific catalyst precisely at the tip of a substrate, (2) Catalyst-induced growth of carbon nanotubes/fibers at the catalyst-deposited tips, (3) Control of carbon nanotube/fiber growth pattern by manipulation of tip shape and growth conditions, and (4) Automation for mass production.

  16. Insulated Conducting Cantilevered Nanotips and Two-Chamber Recording System for High Resolution Ion Sensing AFM

    PubMed Central

    Meckes, Brian; Arce, Fernando Teran; Connelly, Laura S.; Lal, Ratnesh

    2014-01-01

    Biological membranes contain ion channels, which are nanoscale pores allowing controlled ionic transport and mediating key biological functions underlying normal/abnormal living. Synthetic membranes with defined pores are being developed to control various processes, including filtration of pollutants, charge transport for energy storage, and separation of fluids and molecules. Although ionic transport (currents) can be measured with single channel resolution, imaging their structure and ionic currents simultaneously is difficult. Atomic force microscopy enables high resolution imaging of nanoscale structures and can be modified to measure ionic currents simultaneously. Moreover, the ionic currents can also be used to image structures. A simple method for fabricating conducting AFM cantilevers to image pore structures at high resolution is reported. Tungsten microwires with nanoscale tips are insulated except at the apex. This allows simultaneous imaging via cantilever deflections in normal AFM force feedback mode as well as measuring localized ionic currents. These novel probes measure ionic currents as small as picoampere while providing nanoscale spatial resolution surface topography and is suitable for measuring ionic currents and conductance of biological ion channels. PMID:24663394

  17. Probing mechanical properties of living cells by atomic force microscopy with blunted pyramidal cantilever tips.

    PubMed

    Rico, Félix; Roca-Cusachs, Pere; Gavara, Núria; Farré, Ramon; Rotger, Mar; Navajas, Daniel

    2005-08-01

    Atomic force microscopy (AFM) allows the acquisition of high-resolution images and the measurement of mechanical properties of living cells under physiological conditions. AFM cantilevers with blunted pyramidal tips are commonly used to obtain images of living cells. Measurement of mechanical properties with these tips requires a contact model that takes into account their blunted geometry. The aim of this work was to develop a contact model of a blunted pyramidal tip and to assess the suitability of pyramidal tips for probing mechanical properties of soft gels and living cells. We developed a contact model of a blunted pyramidal tip indenting an elastic half-space. We measured Young's modulus (E) and the complex shear modulus (G*= G' +i G" ) of agarose gels and A549 alveolar epithelial cells with pyramidal tips and compared them with those obtained with spherical tips. The gels exhibited an elastic behavior with almost coincident loading and unloading force curves and negligible values of G". E fell sharply with indentation up to approximately 300 nm , showing a linear regime for deeper indentations. A similar indentation dependence of E with twofold lower values at the linear regime was obtained with the spherical tip fitted with Hertz's model. The dependence of E on indentation in cells paralleled that found in gels. Cells exhibited viscoelastic behavior with G"/G' approximately 1/4 . Pyramidal tips commonly used for AFM imaging are suitable for probing mechanical properties of soft gels and living cells. PMID:16196611

  18. Modeling the Interaction between AFM Tips and Pinned Surface Nanobubbles.

    PubMed

    Guo, Zhenjiang; Liu, Yawei; Xiao, Qianxiang; Schönherr, Holger; Zhang, Xianren

    2016-01-26

    Although the morphology of surface nanobubbles has been studied widely with different AFM modes, AFM images may not reflect the real shapes of the nanobubbles due to AFM tip-nanobubble interactions. In addition, the interplay between surface nanobubble deformation and induced capillary force has not been well understood in this context. In our work we used constraint lattice density functional theory to investigate the interaction between AFM tips and pinned surface nanobubbles systematically, especially concentrating on the effects of tip hydrophilicity and shape. For a hydrophilic tip contacting a nanobubble, its hydrophilic nature facilitates its departure from the bubble surface, displaying a weak and intermediate-range attraction. However, when the tip squeezes the nanobubble during the approach process, the nanobubble shows an elastic effect that prevents the tip from penetrating the bubble, leading to a strong nanobubble deformation and repulsive interactions. On the contrary, a hydrophobic tip can easily pierce the vapor-liquid interface of the nanobubble during the approach process, leading to the disappearance of the repulsive force. In the retraction process, however, the adhesion between the tip and the nanobubble leads to a much stronger lengthening effect on nanobubble deformation and a strong long-range attractive force. The trends of force evolution from our simulations agree qualitatively well with recent experimental AFM observations. This favorable agreement demonstrates that our model catches the main intergradient of tip-nanobubble interactions for pinned surface nanobubbles and may therefore provide important insight into how to design minimally invasive AFM experiments. PMID:26751634

  19. Analysis of grating inscribed micro-cantilever for high resolution AFM probe

    NASA Astrophysics Data System (ADS)

    Balajee, N.; Mahapatra, D. R.; Hegde, G. M.

    2013-06-01

    We present a mathematical modelling and analysis of reflection grating etched Si AFM cantilever deflections under different loading conditions. A simple analysis of the effect of grating structures on cantilever deflection is carried out with emphasis on optimizing the beam and gratings such that maximum amount of diffracted light remains within the detector area.

  20. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  1. Accurate Calibration and Uncertainty Estimation of the Normal Spring Constant of Various AFM Cantilevers

    PubMed Central

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-01-01

    Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical properties of materials in the biophysics and nanomechanical fields. The atomic force microscope (AFM) is widely used in microforce measurement. The cantilever probe works as an AFM force sensor, and the spring constant of the cantilever is of great significance to the accuracy of the measurement results. This paper presents a normal spring constant calibration method with the combined use of an electromagnetic balance and a homemade AFM head. When the cantilever presses the balance, its deflection is detected through an optical lever integrated in the AFM head. Meanwhile, the corresponding bending force is recorded by the balance. Then the spring constant can be simply calculated using Hooke’s law. During the calibration, a feedback loop is applied to control the deflection of the cantilever. Errors that may affect the stability of the cantilever could be compensated rapidly. Five types of commercial cantilevers with different shapes, stiffness, and operating modes were chosen to evaluate the performance of our system. Based on the uncertainty analysis, the expanded relative standard uncertainties of the normal spring constant of most measured cantilevers are believed to be better than 2%. PMID:25763650

  2. The Conductance of Nanotubes Deformed by the AFM Tip

    NASA Technical Reports Server (NTRS)

    Svizhenko, Alexei; Maiti, Amitesh; Anantram, M. P.

    2003-01-01

    The conductance drop under AFM-tip deformation can be explained by stretching of the tube length. NT sensors can be built utilizing uniform stretching. Single sp3 bond cross section cannot block electrons, because another conducting path may exist. AFM tip which forms sp3 bonds with the tube will decrease conductance. In the "table experiment" a conductance drop of 2 orders of magnitude happened only after some bonds were broken.

  3. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction.

    PubMed

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-01-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation. PMID:27452115

  4. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    PubMed Central

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-01-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation. PMID:27452115

  5. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    NASA Astrophysics Data System (ADS)

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-07-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation.

  6. Sharp high-aspect-ratio AFM tips fabricated by a combination of deep reactive ion etching and focused ion beam techniques.

    PubMed

    Caballero, David; Villanueva, Guillermo; Plaza, Jose Antonio; Mills, Christopher A; Samitier, Josep; Errachid, Abdelhamid

    2010-01-01

    The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 degrees or nanoscaled structures, standard silicon atomic force microscopy (AFM) tips do not provide satisfactory results. We have combined deep reactive ion etching (DRIE) and focused ion beam (FIB) lithography techniques in order to produce probes with sharp rocket-shaped silicon AFM tips for high resolution imaging. The cantilevers were shaped and the bulk micromachining was performed using the same DRIE equipment. To improve the tip aspect ratio we used FIB nanolithography technique. The tips were tested on narrow silicon trenches and over biological samples showing a better resolution when compared with standard AFM tips, which enables nanocharacterization and nanometrology of high-aspect-ratio structures and nanoscaled biological elements to be completed, and provides an alternative to commercial high aspect ratio AFM tips. PMID:20352882

  7. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy.

    PubMed

    Schürmann, G; Noell, W; Staufer, U; de Rooij, N F; Eckert, R; Freyland, J M; Heinzelmann, H

    2001-10-01

    A cantilever-based probe is introduced for use in scanning near-field optical microscopy (SNOM) combined with scanning atomic-force microscopy (AFM). The probes consist of silicon cantilevers with integrated 25-mum-high fused-silica tips. The probes are batch fabricated by microfabrication technology. Transmission electron microscopy reveals that the transparent quartz tips are completely covered with an opaque aluminum layer before the SNOM measurement. Static and dynamic AFM imaging was performed. SNOM imaging in transmission mode of single fluorescent molecules shows an optical resolution better than 32 nm. PMID:18364783

  8. Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.

    PubMed

    Cumpson, P J Peter J; Zhdan, Peter; Hedley, John

    2004-08-01

    Calibration of the spring constant of atomic force microscope (AFM) cantilevers is necessary for the measurement of nanonewton and piconewton forces, which are critical to analytical applications of AFM in the analysis of polymer surfaces, biological structures and organic molecules. We have developed a compact and easy-to-use reference standard for this calibration. The new artifact consists of an array of 12 dual spiral-cantilever springs, each supporting a mirrored polycrystalline silicon disc of 160 microm in diameter. These devices were fabricated by a three-layer polysilicon surface micromachining method, including a reflective layer of gold on chromium. We call such an array a Microfabricated Array of Reference Springs (MARS). These devices have a number of advantages. Cantilever calibration using this device is straightforward and rapid. The devices have very small inertia, and are therefore resistant to shock and vibration. This means they need no careful treatment except reasonably clean laboratory conditions. The array spans the range of spring constant from around 0.16 to 11 N/m important in AFM, allowing almost all contact-mode AFM cantilevers to be calibrated easily and rapidly. Each device incorporates its own discrete gold mirror to improve reflectivity. The incorporation of a gold mirror both simplifies calibration of the devices themselves (via Doppler velocimetry) and allows interferometric calibration of the AFM z-axis using the apparent periodicity in the force-distance curve before contact. Therefore, from a single force-distance curve, taking about one second to acquire, one can calibrate the cantilever spring constant and, optionally, the z-axis scale. These are all the data one needs to make accurate and reliable force measurements. PMID:15231316

  9. Designer cantilevers for even more accurate quantitative measurements of biological systems with multifrequency AFM

    NASA Astrophysics Data System (ADS)

    Contera, S.

    2016-04-01

    Multifrequency excitation/monitoring of cantilevers has made it possible both to achieve fast, relatively simple, nanometre-resolution quantitative mapping of mechanical of biological systems in solution using atomic force microscopy (AFM), and single molecule resolution detection by nanomechanical biosensors. A recent paper by Penedo et al [2015 Nanotechnology 26 485706] has made a significant contribution by developing simple methods to improve the signal to noise ratio in liquid environments, by selectively enhancing cantilever modes, which will lead to even more accurate quantitative measurements.

  10. Charging C60 islands with the AFM tip.

    PubMed

    Hoff, Brice; Henry, Claude R; Barth, Clemens

    2016-01-01

    We show that electrons can be transferred on demand from an AFM tip into single bulk-like C60 islands, which are supported on the insulating NaCl(001) surface. We exemplify this by controlled charge-manipulation experiments conducted in ultrahigh vacuum by noncontact AFM (nc-AFM), electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). KPFM shows a homogeneous contrast at the islands, which is a signature for an equal distribution of the electrons in the T1u band. The charge dissipates during half a day due to an interaction of the charged C60 islands with defects in the near surface region of NaCl. Our results open the perspective in photo-voltaics to study charge attachment, stability and charge exchange with the environment of any C60 bulk-like system. PMID:26617348

  11. Charging C60 islands with the AFM tip

    NASA Astrophysics Data System (ADS)

    Hoff, Brice; Henry, Claude R.; Barth, Clemens

    2015-12-01

    We show that electrons can be transferred on demand from an AFM tip into single bulk-like C60 islands, which are supported on the insulating NaCl(001) surface. We exemplify this by controlled charge-manipulation experiments conducted in ultrahigh vacuum by noncontact AFM (nc-AFM), electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). KPFM shows a homogeneous contrast at the islands, which is a signature for an equal distribution of the electrons in the T1u band. The charge dissipates during half a day due to an interaction of the charged C60 islands with defects in the near surface region of NaCl. Our results open the perspective in photo-voltaics to study charge attachment, stability and charge exchange with the environment of any C60 bulk-like system.We show that electrons can be transferred on demand from an AFM tip into single bulk-like C60 islands, which are supported on the insulating NaCl(001) surface. We exemplify this by controlled charge-manipulation experiments conducted in ultrahigh vacuum by noncontact AFM (nc-AFM), electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). KPFM shows a homogeneous contrast at the islands, which is a signature for an equal distribution of the electrons in the T1u band. The charge dissipates during half a day due to an interaction of the charged C60 islands with defects in the near surface region of NaCl. Our results open the perspective in photo-voltaics to study charge attachment, stability and charge exchange with the environment of any C60 bulk-like system. Electronic supplementary information (ESI) available. See DOI: 10.1039/C5NR04541J

  12. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging.

    PubMed

    Dukic, Maja; Adams, Jonathan D; Fantner, Georg E

    2015-01-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air. PMID:26574164

  13. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    PubMed Central

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-01-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air. PMID:26574164

  14. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    NASA Astrophysics Data System (ADS)

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-11-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air.

  15. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    NASA Technical Reports Server (NTRS)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  16. Adhesion forces in AFM of redox responsive polymer grafts: Effects of tip hydrophilicity

    NASA Astrophysics Data System (ADS)

    Feng, Xueling; Kieviet, Bernard D.; Song, Jing; Schön, Peter M.; Vancso, G. Julius

    2014-02-01

    The adherence between silicon nitride AFM tips and redox-active poly(ferrocenylsilanes) (PFS) grafts on gold was investigated by electrochemical AFM force spectroscopy. Before the adhesion measurements silicon nitride AFM probes were cleaned with organic solvents (acetone and ethanol) or piranha solution. Interestingly, these different AFM tip cleaning procedures drastically affected the observed adhesion forces. Water contact angle measurements on the corresponding AFM probe chips showed that piranha treatment resulted in a significant increase of AFM probe chip surface hydrophilicity compared to the organic solvent treatment. Obviously this hydrophilicity change caused drastic, even opposite changes in the tip-PFS adhesive force measurement upon electrode potential change to reversibly oxidize and reduce the PFS grafts. Our findings are of pivotal importance for AFM tip adhesion measurements utilizing standard silicon nitride AFM tips. Probe hydrophilicity must be carefully taken into consideration and controlled.

  17. Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM AFM

    NASA Astrophysics Data System (ADS)

    Arai, Toyoko; Tomitori, Masahiko

    1999-04-01

    The interaction force-distance curves between a tip and a sample surface in close proximity were measured by logarithmically changing a tunneling current passing through them with a ultrahigh vacuum scanning tunneling microscopy-atomic force microscopy (UHV STM-AFM). Since the tunneling current changes exponentially with the separation between the tip and the sample, the separation can be controlled precisely and linearly by modulating a logarithmic target value fed into the STM feedback circuit to be a triangular waveform. A piezoresistive cantilever with a conductive Si tip was used after cleaning the tip by heating it in the UHV chamber. As a preliminary result, force-separation curves with reversible and irreversible jumps in close proximity were presented.

  18. Development of tip Scanning High Speed AFM operating at 1,000 Lines/s & 15µm

    NASA Astrophysics Data System (ADS)

    Celik, Umit; Kehribar, Ihsan; Celik, Kubra; Özer, H. Özgür; Oral, Ahmet

    High speed atomic force microscope allows imaging dynamic processes on the surfaces. We have developed a very high speed tip scanning atomic force microscope (HS-AFM). We designed the tip scanning system to overcome the sample size limits, with a beam tracking capability to follow the cantilever motion. A high resonance frequency flexure scanner developed which has 15µm scan range in XY and 3µm in Z axis. A novel FPGA based high speed scanning and data acquisition system was developed. The scanner is driven by sine wave in X-axis to avoid resonances and data were captured at equal sample intervals. 1 KHz line scan rate is achieved at 15µm scan range with the HS-AFM.

  19. Study of the sensitivity and resonant frequency of the torsional modes of an AFM cantilever with a sidewall probe based on a nonlocal elasticity theory.

    PubMed

    Abbasi, Mohammad; Karami Mohammadi, Ardeshir

    2015-05-01

    A relationship based on a nonlocal elasticity theory is developed to investigate the torsional sensitivity and resonant frequency of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever and a vertical extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidewalls of microstructures. First, the governing differential equations of motion and boundary conditions for dynamic analysis are obtained by a combination of the basic equations of nonlocal elasticity theory and Hamilton's principle. Afterward, a closed-form expression for the sensitivity of vibration modes has been obtained using the relationship between the resonant frequency and contact stiffness of cantilever and sample. These analysis accounts for a better representation of the torsional behavior of an AFM with sidewall probe where the small-scale effect are significant. The results of the proposed model are compared with those of classical beam theory. The results show that the sensitivities and resonant frequencies of ACP predicted by the nonlocal elasticity theory are smaller than those obtained by the classical beam theory. PMID:25755027

  20. Phase-Imaging with a Sharpened Multi-Walled Carbon Nanotube AFM Tip: Investigation of Low-k Dielectric Polymer Hybrids

    NASA Technical Reports Server (NTRS)

    Nguyen, Cattien V.; Stevens, Ramsey M.; Meyyappan, M.; Volksen, Willi; Miller, Robert D.

    2005-01-01

    Phase shift tapping mode scanning force microscopy (TMSFM) has evolved into a very powerful technique for the nanoscale surface characterization of compositional variations in heterogeneous samples. Phase shift signal measures the difference between the phase angle of the excitation signal and the phase angle of the cantilever response. The signal correlates to the tip-sample inelastic interactions, identifying the different chemical and/or physical property of surfaces. In general, the resolution and quality of scanning probe microscopic images are highly dependent on the size of the scanning probe tip. In improving AFM tip technology, we recently developed a technique for sharpening the tip of a multi-walled carbon nanotube (CNT) AFM tip, reducing the radius of curvature of the CNT tip to less than 5 nm while still maintaining the inherent stability of multi-walled CNT tips. Herein we report the use of sharpened (CNT) AFM tips for phase-imaging of polymer hybrids, a precursor for generating nanoporous low-k dielectrics for on-chip interconnect applications. Using sharpened CNT tips, we obtained phase-contrast images having domains less than 10 nm. In contrast, conventional Si tips and unsharpened CNT tips (radius greater than 15 nm) were not able to resolve the nanoscale domains in the polymer hybrid films. C1early, the size of the CNT tip contributes significantly to the resolution of phase-contrast imaging. In addition, a study on the nonlinear tapping dynamics of the multi-walled CNT tip indicates that the multi-walled CNT tip is immune to conventional imaging instabilities related to the coexistence of attractive and repulsive tapping regimes. This factor may also contribute to the phase-contrast image quality of multi-walled CNT AFM tips. This presentation will also offer data in support of the stability of the CNT tip for phase shift TMSFM.

  1. Adhesion forces between AFM tips and superficial dentin surfaces.

    PubMed

    Pelin, I M; Piednoir, A; Machon, D; Farge, P; Pirat, C; Ramos, S M M

    2012-06-15

    In this work, we study the adhesion forces between atomic force microscopy (AFM) tips and superficial dentin etched with phosphoric acid. Initially, we quantitatively analyze the effect of acid etching on the surface heterogeneity and the surface roughness, two parameters that play a key role in the adhesion phenomenon. From a statistical study of the force-distance curves, we determine the average adhesion forces on the processed substrates. Our results show that the average adhesion forces, measured in water, increase linearly with the acid exposure time. The highest values of such forces are ascribed to the high density of collagen fibers on the etched surfaces. The individual contribution of exposed collagen fibrils to the adhesion force is highlighted. We also discuss in this paper the influence of the environmental medium (water/air) in the adhesion measurements. We show that the weak forces involved require working in the aqueous medium. PMID:22472512

  2. Optimization of Q-factor of AFM cantilevers using genetic algorithms.

    PubMed

    Perez-Cruz, Angel; Dominguez-Gonzalez, Aurelio; Stiharu, Ion; Osornio-Rios, Roque A

    2012-04-01

    Micro cantilever beams have been intensively used in sensing applications including to scanning profiles and surfaces where there resolution and imaging speed are critical. Force resolution is related to the Q-factor. When the micro-cantilever operates in air with small separation gaps, the Q-factor is even more reduced due to the squeeze-film damping effect. Thus, the optimization of the configuration of an AFM micro-cantilever is presented in this work with the objective of improving its Q-factor. To accomplish this task, we propose the inclusion of holes as breathing chimneys in the initial design to reduce the squeeze-film damping effect. The evaluation of the Q-factor was carried out using finite element model, which is implemented to work together with the squeeze-film damping model. The methodology applied in the optimization process was genetic algorithms, which considers as constraints the maximum allowable stress, fundamental frequency and spring constant with respect to the initial design. The results show that the optimum design, which includes holes with an optimal location, increases the Q-factor almost five times compared to the initial design. PMID:22459119

  3. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew; Eardley, Matthew; Kitching, John

    2015-05-01

    We report the resonant coupling of laser cooled trapped Rb atoms to a micro-cantilever with a magnetic tip. An atom chip is used to trap, cool, and transport the atoms to the tip of the cantilever. The capacitively-driven cantilever oscillation produces Zeeman state transitions which result in a loss of population in the trap. In a suitably scaled setup, mechanical resonators could be used to probe and manipulate atomic spins with nanometer spatial resolution and single-spin sensitivity; this technique may enable new approaches in neutral-atom quantum computation, quantum simulation, or precision sensing.

  4. Single Dimer E-Cadherin Interaction Forces Characterized Using Modified AFM Cantilevers

    NASA Astrophysics Data System (ADS)

    Rudnitsky, Robert; Drees, Frauke; Nelson, W. James; Kenny, Thomas

    2002-03-01

    In tissue monolayers, adhesion between cells is accomplished chiefly through the action of [Ca++] dependent cadherin proteins. E-cadherin molecules coalesce into large plaques on contacting membranes of adjacent cells. Using specialized AFM cantilevers functionalized with tethered E-cadherin proteins, we studied the interaction forces of trans dimers from the single bond level through to the higher surface densities found in plaques, with pico-Newton force resolution. The measurements demonstrated the dependence of E-cadherin homoassociation on surface protein density. Previous in-vivo studies established the role of Ca++ in E-cadherin adhesion in whole cells. Advances in AFM force spectroscopy allowed us to characterize the unbinding process under force loads, and to differentiate single and multiple molecular binding events. The data correlates the dependence of E-cadherin adhesion at a molecular level to [Ca++], revealing interaction details that cannot be observed using whole-cell studies. This work is supported by NSF (XYZ on a Chip Program) CMS-9980838, NIH (GMB5227), and the Fannie and John Hertz Foundation.

  5. High precision attachment of silver nanoparticles on AFM tips by dielectrophoresis.

    PubMed

    Leiterer, Christian; Wünsche, Erik; Singh, Prabha; Albert, Jens; Köhler, Johann M; Deckert, Volker; Fritzsche, Wolfgang

    2016-05-01

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application. Graphical abstract Silver nanoparticles attached to AFM tips using dielectrophoresis. Comparing nanoparticles attached using 1 kHz (left) to 1 MHz (right), SEM and optical (inset) images. PMID:26968565

  6. Measurement of interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} and immobilized vitronectin on the cantilever tip

    SciTech Connect

    Lee, Minsu; Yang, Hyun-Kyu; Park, Keun-Hyung; Kang, Dong-Ku; Chang, Soo-Ik Kang, In-Cheol

    2007-11-03

    Protein nanoarrays containing integrin {alpha}{sub v}{beta}{sub 3} or BSA were fabricated on ProLinker{sup TM}-coated Au surface by dip-pen nanolithography (DPN). An atomic force microscope (AFM) tip coated with ProLinker{sup TM} was modified by vitronectin. We measured the interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} or BSA and immobilized vitronectin on the cantilever tip by employing tethering-unbinding method. The unbinding force between integrin {alpha}{sub v}{beta}{sub 3} and vitronectin (1087 {+-} 62 pN) was much higher than that of between BSA and vitronectin (643 {+-} 74 pN). These results demonstrate that one can distinguish a specific protein interaction from non-specific interactions by means of force measurement on the molecular interactions between the nanoarrayed protein and its interacting protein on the AFM tip.

  7. AFM tip characterization by using FFT filtered images of step structures.

    PubMed

    Yan, Yongda; Xue, Bo; Hu, Zhenjiang; Zhao, Xuesen

    2016-01-01

    The measurement resolution of an atomic force microscope (AFM) is largely dependent on the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the value of the tip radius is needed in calculations. As such, estimation of the tip radius is important for analyzing results taken using an AFM. In this study, a geometrical model created by scanning a step structure with an AFM tip was developed. The tip was assumed to have a hemispherical cone shape. Profiles simulated by tips with different scanning radii were calculated by fast Fourier transform (FFT). By analyzing the influence of tip radius variation on the spectra of simulated profiles, it was found that low-frequency harmonics were more susceptible, and that the relationship between the tip radius and the low-frequency harmonic amplitude of the step structure varied monotonically. Based on this regularity, we developed a new method to characterize the radius of the hemispherical tip. The tip radii estimated with this approach were comparable to the results obtained using scanning electron microscope imaging and blind reconstruction methods. PMID:26517548

  8. Nanomechanical probing of soft matter through hydrophobic AFM tips fabricated by two-photon polymerization

    NASA Astrophysics Data System (ADS)

    Suriano, Raffaella; Zandrini, Tommaso; De Marco, Carmela; Osellame, Roberto; Turri, Stefano; Bragheri, Francesca

    2016-04-01

    Atomic force microscopy (AFM) nanoindentation of soft materials is a powerful tool for probing mechanical properties of biomaterials. Though many results have been reported in this field over the last decade, adhesion forces between the tip and the sample hinder the elastic modulus measurement when hydrophilic soft samples are investigated. Here, two-photon polymerization (2PP) technology was used to fabricate hydrophobic perfluoropolyether-based AFM tips. The hydrophobic 2PP tips allowed us to overcome the limitations of commercial and functionalized tips as well as to successfully measure the elastic modulus of medically relevant soft materials in air. Our results obtained in the characterization of poly(dimethyl siloxane) and polyethylene glycol hydrogels showed lower adhesion forces over a larger measurement range when compared to measurements performed with commercial tips. The elastic moduli measured by means of hydrophobic 2PP AFM tips were also found to be comparable to those obtained using conventional techniques for macroscopic samples. We successfully showed that the hydrophobic AFM tips developed by this highly versatile technology enable the study of mechanical properties of soft matter, benefiting from reduced sample-tip interactions, and a custom-made shape and dimension of the tips.

  9. Nanomechanical probing of soft matter through hydrophobic AFM tips fabricated by two-photon polymerization.

    PubMed

    Suriano, Raffaella; Zandrini, Tommaso; De Marco, Carmela; Osellame, Roberto; Turri, Stefano; Bragheri, Francesca

    2016-04-15

    Atomic force microscopy (AFM) nanoindentation of soft materials is a powerful tool for probing mechanical properties of biomaterials. Though many results have been reported in this field over the last decade, adhesion forces between the tip and the sample hinder the elastic modulus measurement when hydrophilic soft samples are investigated. Here, two-photon polymerization (2PP) technology was used to fabricate hydrophobic perfluoropolyether-based AFM tips. The hydrophobic 2PP tips allowed us to overcome the limitations of commercial and functionalized tips as well as to successfully measure the elastic modulus of medically relevant soft materials in air. Our results obtained in the characterization of poly(dimethyl siloxane) and polyethylene glycol hydrogels showed lower adhesion forces over a larger measurement range when compared to measurements performed with commercial tips. The elastic moduli measured by means of hydrophobic 2PP AFM tips were also found to be comparable to those obtained using conventional techniques for macroscopic samples. We successfully showed that the hydrophobic AFM tips developed by this highly versatile technology enable the study of mechanical properties of soft matter, benefiting from reduced sample-tip interactions, and a custom-made shape and dimension of the tips. PMID:26926558

  10. DNA-coated AFM cantilevers for the investigation of cell adhesion and the patterning of live cells

    SciTech Connect

    Hsiao, Sonny C.; Crow, Ailey K.; Lam, Wilbur A.; Bertozzi, Carolyn R.; Fletcher, Daniel A.; Francis, Matthew B.

    2008-08-01

    Measurement of receptor adhesion strength requires the precise manipulation of single cells on a contact surface. To attach live cells to a moveable probe, DNA sequences complementary to strands displayed on the plasma membrane are introduced onto AFM cantilevers (see picture, bp=base pairs). The strength of the resulting linkages can be tuned by varying the length of DNA strands, allowing for controlled transport of the cells.

  11. Sobol method application in dimensional sensitivity analyses of different AFM cantilevers for biological particles

    NASA Astrophysics Data System (ADS)

    Korayem, M. H.; Taheri, M.; Ghahnaviyeh, S. D.

    2015-08-01

    Due to the more delicate nature of biological micro/nanoparticles, it is necessary to compute the critical force of manipulation. The modeling and simulation of reactions and nanomanipulator dynamics in a precise manipulation process require an exact modeling of cantilevers stiffness, especially the stiffness of dagger cantilevers because the previous model is not useful for this investigation. The stiffness values for V-shaped cantilevers can be obtained through several methods. One of them is the PBA method. In another approach, the cantilever is divided into two sections: a triangular head section and two slanted rectangular beams. Then, deformations along different directions are computed and used to obtain the stiffness values in different directions. The stiffness formulations of dagger cantilever are needed for this sensitivity analyses so the formulations have been driven first and then sensitivity analyses has been started. In examining the stiffness of the dagger-shaped cantilever, the micro-beam has been divided into two triangular and rectangular sections and by computing the displacements along different directions and using the existing relations, the stiffness values for dagger cantilever have been obtained. In this paper, after investigating the stiffness of common types of cantilevers, Sobol sensitivity analyses of the effects of various geometric parameters on the stiffness of these types of cantilevers have been carried out. Also, the effects of different cantilevers on the dynamic behavior of nanoparticles have been studied and the dagger-shaped cantilever has been deemed more suitable for the manipulation of biological particles.

  12. Closed-form solution for a cantilevered sectorial plate subjected to a tip concentrated force.

    PubMed

    Christy, Carl W; Weggel, David C; Smelser, R E

    2016-01-01

    A closed-form solution is presented for a cantilevered sectorial plate subjected to a tip concentrated force. Since the particular solution for this problem was not found in the literature, it is derived here. Deflections from the total solution (particular plus homogeneous solutions) are compared to those from a finite element analysis and are found to be in excellent agreement, producing an error within approximately 0.08 %. Normalized closed-form deflections and slopes at the fixed support, resulting from an approximate enforcement of the boundary conditions there, deviate from zero by <0.08 %. Finally, the total closed-form solutions for a cantilevered sectorial plate subjected to independent applications of a tip concentrated force, a tip bending moment, and a tip twisting moment, are compiled. PMID:27390653

  13. Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End

    PubMed Central

    Gonzalez, Laura; Martínez-Martín, David; Otero, Jorge; de Pablo, Pedro José; Puig-Vidal, Manel; Gómez-Herrero, Julio

    2015-01-01

    The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. PMID:25594596

  14. Rational fabrication of a gold-coated AFM TERS tip by pulsed electrodeposition.

    PubMed

    Yang, Li-Kun; Huang, Teng-Xiang; Zeng, Zhi-Cong; Li, Mao-Hua; Wang, Xiang; Yang, Fang-Zu; Ren, Bin

    2015-11-21

    Reproducible fabrication of sharp gold- or silver-coated tips has become the bottleneck issue in tip-enhanced Raman spectroscopy, especially for atomic force microscopy (AFM)-based TERS. Herein, we developed a novel method based on pulsed electrodeposition to coat a thin gold layer over atomic force microscopy (AFM) tips to produce plasmonic TERS tips with high reproducibility. We systematically investigated the influence of the deposition potential and step time on the surface roughness and sharpness. This method allows the rational control of the radii of gold-coated TERS tips from a few to hundreds of nanometers, which allows us to systematically study the dependence of the TERS enhancement on the radius of the gold-coated AFM tip. The maximum TERS enhancement was achieved for the tip radius in the range of 60-75 nm in the gap mode. The coated gold layer has a strong adhesion with the silicon tip surface, which is highly stable in water, showing the great potential for application in the aqueous environment. PMID:26482226

  15. Reconstruction of an AFM image based on estimation of the tip shape

    NASA Astrophysics Data System (ADS)

    Yuan, Shuai; Luan, Fangjun; Song, Xiaoyu; Liu, Lianqing; Liu, Jifei

    2013-10-01

    From the viewpoint of mathematical morphology, an atomic force microscopy (AFM) image contains the distortion effect of the tip convolution on a real sample surface. If tip shape can be characterized accurately, mathematical deconvolution can be applied to reduce the distortion to obtain more precise AFM images. AFM image reconstruction has practical significance in nanoscale observation and manipulation technology. Among recent tip modeling algorithms, the blind tip evaluation algorithm based on mathematical morphology is widely used. However, it takes considerable computing time, and the noise threshold is hard to optimize. To tackle these problems, a new blind modeling method is proposed in this paper to accelerate the computation of the algorithm and realize the optimum threshold estimation to build a precise tip model. The simulation verifies the efficiency of the new algorithm by comparing the computing time with the original one. The calculated tip shape is also validated by comparison with the SEM image of the tip. Finally, the reconstruction of a carbon nanotube image based on the precise tip model illustrates the feasibility and validity of the proposed algorithm.

  16. Rational fabrication of a gold-coated AFM TERS tip by pulsed electrodeposition

    NASA Astrophysics Data System (ADS)

    Yang, Li-Kun; Huang, Teng-Xiang; Zeng, Zhi-Cong; Li, Mao-Hua; Wang, Xiang; Yang, Fang-Zu; Ren, Bin

    2015-10-01

    Reproducible fabrication of sharp gold- or silver-coated tips has become the bottleneck issue in tip-enhanced Raman spectroscopy, especially for atomic force microscopy (AFM)-based TERS. Herein, we developed a novel method based on pulsed electrodeposition to coat a thin gold layer over atomic force microscopy (AFM) tips to produce plasmonic TERS tips with high reproducibility. We systematically investigated the influence of the deposition potential and step time on the surface roughness and sharpness. This method allows the rational control of the radii of gold-coated TERS tips from a few to hundreds of nanometers, which allows us to systematically study the dependence of the TERS enhancement on the radius of the gold-coated AFM tip. The maximum TERS enhancement was achieved for the tip radius in the range of 60-75 nm in the gap mode. The coated gold layer has a strong adhesion with the silicon tip surface, which is highly stable in water, showing the great potential for application in the aqueous environment.

  17. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew A.; Eardley, Matthew; Moreland, John; Hollberg, Leo; Kitching, John

    2015-06-01

    Magnetic resonance in an ensemble of laser-cooled trapped Rb atoms is excited using a microcantilever with a magnetic tip. The cantilever is mounted on a multilayer chip designed to capture, cool, and magnetically transport cold atoms. The coupling is observed by measuring the loss from a magnetic trap as the oscillating cantilever induces Zeeman-state transitions in the atoms. Interfacing cold atoms with mechanical devices could enable probing and manipulating atomic spins with nanometer spatial resolution and single-spin sensitivity, leading to new capabilities in quantum computation, quantum simulation, and precision sensing.

  18. Linking of sensor molecules with amino groups to amino-functionalized AFM tips.

    PubMed

    Wildling, Linda; Unterauer, Barbara; Zhu, Rong; Rupprecht, Anne; Haselgrübler, Thomas; Rankl, Christian; Ebner, Andreas; Vater, Doris; Pollheimer, Philipp; Pohl, Elena E; Hinterdorfer, Peter; Gruber, Hermann J

    2011-06-15

    The measuring tip of an atomic force microscope (AFM) can be upgraded to a specific biosensor by attaching one or a few biomolecules to the apex of the tip. The biofunctionalized tip is then used to map cognate target molecules on a sample surface or to study biophysical parameters of interaction with the target molecules. The functionality of tip-bound sensor molecules is greatly enhanced if they are linked via a thin, flexible polymer chain. In a typical scheme of tip functionalization, reactive groups are first generated on the tip surface, a bifunctional cross-linker is then attached with one of its two reactive ends, and finally the probe molecule of interest is coupled to the free end of the cross-linker. Unfortunately, the most popular functional group generated on the tip surface is the amino group, while at the same time, the only useful coupling functions of many biomolecules (such as antibodies) are also NH(2) groups. In the past, various tricks or detours were applied to minimize the undesired bivalent reaction of bifunctional linkers with adjacent NH(2) groups on the tip surface. In the present study, an uncompromising solution to this problem was found with the help of a new cross-linker ("acetal-PEG-NHS") which possesses one activated carboxyl group and one acetal-protected benzaldehyde function. The activated carboxyl ensures rapid unilateral attachment to the amino-functionalized tip, and only then is the terminal acetal group converted into the amino-reactive benzaldehyde function by mild treatment (1% citric acid, 1-10 min) which does not harm the AFM tip. As an exception, AFM tips with magnetic coating become demagnetized in 1% citric acid. This problem was solved by deprotecting the acetal group before coupling the PEG linker to the AFM tip. Bivalent binding of the corresponding linker ("aldehyde-PEG-NHS") to adjacent NH(2) groups on the tip was largely suppressed by high linker concentrations. In this way, magnetic AFM tips could be

  19. Cleaning of Dust between Interactive Contact Surfaces by Application of Normal Loads of Artificial Stainless-Cantilever in AFM

    NASA Astrophysics Data System (ADS)

    Choi, Seungchol; Horie, Mikio; Ando, Yasuhisa

    In this study, we investigated that interactive contact surfaces were affected by dust and applied normal loads of cantilever such as bristles. In order to study the effect of interactive contact surfaces, spherical particles (dry borosilicate glass sphere, plastic sphere) with curvature radius (R=5 μm, R=10 μm) were glued to artificial stainless cantilevers (spring constant k=576.7 N/m). The experiments were performed on various normal applied loads using an AFM (Atomic force microscope). The results indicate that spheres with a small curvature radius removed dust more effectively than did either of those with a large curvature radius, abraded by using the stainless cantilever, over the wide contact area (50 μmx50 μm). The plastic spheres tend to deform more than do the borosilicate glass spheres under the same applied load and the spheres with a smaller curvature radius tend to deform than do those with a larger curvature radius and the same material properties. Therefore, it had an influence on interactive surface forces. Restructuring dust aggregates by sliding a cantilever, as well as applying loads and contact pressure, forms a new micro contact area, which influences micro surface forces.

  20. An active reference spring array for in-situ calibration of the normal spring constant of AFM cantilevers

    NASA Astrophysics Data System (ADS)

    Gao, S.; Brand, U.; Hahn, S.; Hiller, K.

    2015-05-01

    In this paper the concept of an "active reference spring array (ARSA)" for the AFM cantilever normal spring constant calibration is proposed. The ARSA with nominal stiffness varying from 0.4 N/m to 150 N/m will be available on these arrays with the aim to calibrate the normal stiffness of cantilevers ranging from 0.04 N/m to 1500 N/m. The fabrication process of the MEMS ARSA on basis of the Bonding Deep RIE technology developed at Chemnitz University of Technology is reported. A first characterization of the MEMS and the traceable determination of the stiffness of the MEMS suspending system have been realized. First experimental results compare very well with the Finite Element (FE) simulation of the numerical design, and prove the feasibility of the proposed concept.

  1. Conservative and dissipative tip-sample interaction forces probed with dynamic AFM

    NASA Astrophysics Data System (ADS)

    Gotsmann, B.; Seidel, C.; Anczykowski, B.; Fuchs, H.

    1999-10-01

    The conservative and dissipative forces between tip and sample of a dynamic atomic force microscopy (AFM) were investigated using a combination of computer simulations and experimental AFM data obtained by the frequency modulation technique. In this way it became possible to reconstruct complete force versus distance curves and damping coefficient versus distance curves from experimental data without using fit parameters for the interaction force and without using analytical interaction models. A comparison with analytical approaches is given and a way to determine a damping coefficient curve from experimental data is proposed. The results include the determination of the first point of repulsive contact of a vibrating tip when approaching a sample. The capability of quantifying the tip-sample interaction is demonstrated using experimental data obtained with a silicon tip and a mica sample in UHV.

  2. Effects of lateral tip control in CD-AFM width metrology

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald; Ng, Boon Ping; Orji, Ndubuisi

    2014-09-01

    Critical dimension atomic force microscopes (CD-AFMs) use flared tips and two-dimensional sensing and position control of the tip-sample interaction to enable scanning of features with near-vertical or reentrant sidewalls. Sidewall sensing usually involves lateral dither of the tip, which was the case in the first two generations of CD-AFM. Current, third-generation instruments also have a fast dither tube actuation (FDTA) mode where a control algorithm and fast response piezo actuator are used to position the tip in a manner that resembles touch-triggering of coordinate measuring machines (CMMs). All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. When lateral dithering is involved, this effect is readily understood as the addition of a dither envelope to the geometrical tip width. The effective tip width is a key correction parameter for accurate feature width measurements and is typically estimated using a tip calibration procedure. However, the possibility exists of small errors in the estimated tip width due to variations and dependencies of the effective width on tip, tool, material, and environmental parameters. We are investigating this possibility through a systematic study of the dependence of the apparent width on measurement mode, dither amplitude, tip type, and sample composition. While we believe that there are potential effects that should be considered carefully, we also conclude, particularly for silicon features, that most potential biases can be removed by performing the calibration and measurement exercises under the same conditions.

  3. Dynamics of the nanoneedle probe in trolling mode AFM.

    PubMed

    Abdi, Ahmad; Pishkenari, Hossein Nejat; Keramati, Ramtin; Minary-Jolandan, Majid

    2015-05-22

    Atomic force microscopy (AFM), as an indispensable tool for nanoscale characterization, presents major drawbacks for operation in a liquid environment arising from the large hydrodynamic drag on the vibrating cantilever. The newly introduced 'Trolling mode' (TR-mode) AFM resolves this complication by using a specialized nanoneedle cantilever that keeps the cantilever outside of the liquid. Herein, a mechanical model with a lumped mass was developed to capture the dynamics of such a cantilever with a nanoneedle tip. This new developed model was applied to investigate the effects of the needle-liquid interface on the performance of the AFM, including the imaging capability in liquid. PMID:25915451

  4. Large deflections of a cantilever beam under arbitrarily directed tip load

    NASA Technical Reports Server (NTRS)

    Mccomb, H. E., Jr.

    1985-01-01

    The nonlinear beam equation was integrated numerically in a direct fashion to obtain results for large deflections of cantilevers under tip loads of arbitrary direction. A short BASIC computer program for performing this integration is presented. Results for selected load cases are presented. The numerical process is performed rapidly on a modern microcomputer, and comparisons with results from closed form solutions show that the process is accurate.

  5. Single cell adhesion force measurement for cell viability identification using an AFM cantilever-based micro putter

    NASA Astrophysics Data System (ADS)

    Shen, Yajing; Nakajima, Masahiro; Kojima, Seiji; Homma, Michio; Kojima, Masaru; Fukuda, Toshio

    2011-11-01

    Fast and sensitive cell viability identification is a key point for single cell analysis. To address this issue, this paper reports a novel single cell viability identification method based on the measurement of single cell shear adhesion force using an atomic force microscopy (AFM) cantilever-based micro putter. Viable and nonviable yeast cells are prepared and put onto three kinds of substrate surfaces, i.e. tungsten probe, gold and ITO substrate surfaces. A micro putter is fabricated from the AFM cantilever by focused ion beam etching technique. The spring constant of the micro putter is calibrated using the nanomanipulation approach. The shear adhesion force between the single viable or nonviable cell and each substrate is measured using the micro putter based on the nanorobotic manipulation system inside an environmental scanning electron microscope. The adhesion force is calculated based on the deflection of the micro putter beam. The results show that the adhesion force of the viable cell to the substrate is much larger than that of the nonviable cell. This identification method is label free, fast, sensitive and can give quantitative results at the single cell level.

  6. Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup

    PubMed Central

    2013-01-01

    This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also discuss the mechanisms involved in the attachment of the Au-NP to the very apex of an AFM probe tip. The Au-NP-modified AFM tips were used to pick up individual 4-nm quantum dots (QDs) using a chemically functionalized method. Single QD blinking was reduced considerably on the Au-NP-modified AFM tip. The resulting AFM tips present an excellent platform for the manipulation of single protein molecules in the study of single protein-protein interactions. PMID:24237663

  7. Simulation of CNT-AFM tip based on finite element analysis for targeted probe of the biological cell

    NASA Astrophysics Data System (ADS)

    Yousefi, Amin Termeh; Mahmood, Mohamad Rusop; Miyake, Mikio; Ikeda, Shoichiro

    2016-07-01

    Carbon nanotubes (CNTs) are potentially ideal tips for atomic force microscopy (AFM) due to the robust mechanical properties, nano scale diameter and also their ability to be functionalized by chemical and biological components at the tip ends. This contribution develops the idea of using CNTs as an AFM tip in computational analysis of the biological cell's. Finite element analysis employed for each section and displacement of the nodes located in the contact area was monitored by using an output database (ODB). This reliable integration of CNT-AFM tip process provides a new class of high performance nanoprobes for single biological cell analysis.

  8. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers

    SciTech Connect

    Grutzik, Scott J.; Zehnder, Alan T.; Gates, Richard S.; Gerbig, Yvonne B.; Smith, Douglas T.; Cook, Robert F.

    2013-11-15

    There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is required. In most cases, the forces of interest are very small, thus compliant cantilevers are used. A number of methods have been developed that are well suited to measuring low stiffness values. However, in some cases a cantilever with much greater stiffness is required. Thus, a direct, traceable method for calibrating very stiff (approximately 200 N/m) cantilevers is presented here. The method uses an instrumented and calibrated nanoindenter to determine the stiffness of a reference cantilever. This reference cantilever is then used to measure the stiffness of a number of AFM test cantilevers. This method is shown to have much smaller uncertainty than previously proposed methods. An example application to fracture testing of nanoscale silicon beam specimens is included.

  9. The thermal stability of Pt/Ir coated AFM tips for resistive switching measurements

    NASA Astrophysics Data System (ADS)

    Wojtyniak, M.; Szot, K.; Waser, R.

    2011-06-01

    In this paper, we focus on the thermally treated atomic force microscope tips used in the investigation of the resistive switching phenomenon. Since the resistive switching phenomenon is often connected with the red-ox process, it is crucial to investigate the influence of oxidizing and reducing conditions at elevated temperatures on typical AFM tips. To fully characterize the influence of different conditions on the tip properties we used several techniques such as: X-ray photoelectron spectroscopy, scanning electron microscopy, transmission electron microscopy and local-conductivity atomic force microscopy. The chemical composition as well as the topography and morphology of the most popular Pt/Ir coated silicon tips were investigated. The influence of thermal treatment on the tip apex was also imaged and the changes in the electrical behavior of the tip coating were observed. Applied temperatures ranges were: 500-700 ° C for oxidizing conditions (air) and 300-700 ° C for reducing conditions (vacuum 10 -6 Torr), the annealing time was set to 0.5 h. Results yielded the formation of Pt 2Si and SiO 2 on the tip surface. The Pt tends to agglomerate into particles over time, depending on the temperature and conditions. The tip apex radius increases while the electrical conductivity decreases with the temperature. In conclusion, even the lowest applied temperature leads to changes in the tip properties, while these changes are much more pronounced under oxidizing conditions.

  10. Transverse vibration and buckling of a cantilevered beam with tip body under constant axial base acceleration

    NASA Technical Reports Server (NTRS)

    Storch, J.; Gates, S.

    1983-01-01

    The planar transverse bending behavior of a uniform cantilevered beam with rigid tip body subject to constant axial base acceleration was analyzed. The beam is inextensible and capable of small elastic transverse bending deformations only. Two classes of tip bodies are recognized: (1) mass centers located along the beam tip tangent line; and (2) mass centers with arbitrary offset towards the beam attachment point. The steady state response is studied for the beam end condition cases: free, tip mass, tip body with restricted mass center offset, and tip body with arbitrary mass center offset. The first three cases constitute classical Euler buckling problems, and the characteristic equation for the critical loads/accelerations are determined. For the last case a unique steady state solution exists. The free vibration response is examined for the two classes of tip body. The characteristic equation, eigenfunctions and their orthogonality properties are obtained for the case of restricted mass center offset. The vibration problem is nonhomogeneous for the case of arbitrary mass center offset. The exact solution is obtained as a sum of the steady state solution and a superposition of simple harmonic motions.

  11. Rapid detection of bacterial resistance to antibiotics using AFM cantilevers as nanomechanical sensors

    NASA Astrophysics Data System (ADS)

    Longo, G.; Alonso-Sarduy, L.; Rio, L. Marques; Bizzini, A.; Trampuz, A.; Notz, J.; Dietler, G.; Kasas, S.

    2013-07-01

    The widespread misuse of drugs has increased the number of multiresistant bacteria, and this means that tools that can rapidly detect and characterize bacterial response to antibiotics are much needed in the management of infections. Various techniques, such as the resazurin-reduction assays, the mycobacterial growth indicator tube or polymerase chain reaction-based methods, have been used to investigate bacterial metabolism and its response to drugs. However, many are relatively expensive or unable to distinguish between living and dead bacteria. Here we show that the fluctuations of highly sensitive atomic force microscope cantilevers can be used to detect low concentrations of bacteria, characterize their metabolism and quantitatively screen (within minutes) their response to antibiotics. We applied this methodology to Escherichia coli and Staphylococcus aureus, showing that live bacteria produced larger cantilever fluctuations than bacteria exposed to antibiotics. Our preliminary experiments suggest that the fluctuation is associated with bacterial metabolism.

  12. Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip

    PubMed Central

    2014-01-01

    The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. PMID:25114660

  13. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  14. AFM fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe

    SciTech Connect

    Van Berkel, Gary J.

    2015-06-23

    An electrospray system comprises a liquid extraction surface sampling probe. The probe comprises a probe body having a liquid inlet and a liquid outlet, and having a liquid extraction tip. A solvent delivery conduit is provided for receiving solvent liquid from the liquid inlet and delivering the solvent liquid to the liquid extraction tip. An open liquid extraction channel extends across an exterior surface of the probe body from the liquid extraction tip to the liquid outlet. An electrospray emitter tip is in liquid communication with the liquid outlet of the liquid extraction surface sampling probe. A system for analyzing samples, a liquid junction surface sampling system, and a method of analyzing samples are also disclosed.

  15. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Wagner, R.; Woehl, T. J.; Keller, R. R.; Killgore, J. P.

    2016-07-01

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  16. Effects of Tip Mass on Stability of Rotating Cantilever Pipe Conveying Fluid with Crack

    NASA Astrophysics Data System (ADS)

    Son, In Soo; Yoon, Han Ik; Lee, Sang Pil; Kim, Dong Jin

    In this paper, the dynamic stability of a rotating cantilever pipe conveying fluid with a crack and tip mass is investigated by numerical method. That is, the effects of the rotating the rotating angular velocity, the mass ratio, the crack and tip mass on the critical flow velocity for flutter instability of system are studied. The equations of motion of rotating pipe are derived by using the extended Hamilton's principle. The crack section of pipe is represented by a local flexibility matrix connecting two undamaged pipe segments. The crack is assumed to be in the first mode of fracture and always opened during the vibrations. Finally, the stability maps of the cracked rotating pipe system as a rotating angular velocity and mass ratio β are presented.

  17. A study of water droplet between an AFM tip and a substrate using dissipative particle dynamics

    NASA Astrophysics Data System (ADS)

    Pal, Souvik; Lan, Chuanjin; Li, Zhen; Hirleman, E. Daniel; Ma, Yanbao

    2014-11-01

    Formation of a water droplet between a sharp AFM tip and a substrate due to capillary condensation affects the tip-substrate interaction. As a consequence, AFM measurements lose precision and often produce incorrect sample topology. Understanding the physics of liquid bridges is also important in the field of Dip-pen nanolithography (DPN). Significant research is being carried out to understand the mechanics of the formation of the liquid bridge and its dependence of surface properties, ambient conditions etc. The in-between length scale, i.e., mesoscale (~100 nm) associated with this phenomenon presents a steep challenge for experimental measurements. In addition, molecular dynamics (MD) can be computationally prohibitive to model the entire system, especially over microseconds to seconds. Theoretical analysis using Young Laplace equation has so far provided some qualitative insights only. We study this system using Dissipative Particle Dynamics (DPD) which is a simulation technique suitable for describing mesoscopic hydrodynamic behavior of fluids. In this work, we carry out simulations to improve understanding of the process of formation of the meniscus, the mechanics of manipulation and control of its shape, and better estimation of capillary forces. The knowledge gained through our study will help in correcting the AFM measurements affected by capillary condensation. Moreover, it will improve understanding of more accurate droplet manipulation in DPN.

  18. An explicit solution of the large deformation of a cantilever beam under point load at the free tip

    NASA Astrophysics Data System (ADS)

    Wang, Ji; Chen, Jian-Kang; Liao, Shijun

    2008-03-01

    The large deformation of a cantilever beam under point load at the free tip is investigated by an analytic method, namely the homotopy analysis method (HAM). The explicit analytic formulas for the rotation angle at the free tip are given, which provide a convenient and straightforward approach to calculate the vertical and horizontal displacements of a cantilever beam with large deformation. These explicit formulas are valid for most practical problems, thus providing a useful reference for engineering applications. The corresponding Mathematica code is given in the Appendix.

  19. Tapping and contact mode imaging of native chromosomes and extraction of genomic DNA using AFM tips

    NASA Astrophysics Data System (ADS)

    Sun, Yingchun; Arakawa, Hideo; Osada, Toshiya; Ikai, Atsushi

    2002-03-01

    It is very important both in medicine and biology to clarify the chromosomal structure to understand its functions. In a standard cytogenetic procedure, chromosomes are often fixed in a mixture of acetic acid and methanol. This process most likely changes the mechanical property of chromosomes. We adopted a method to prepare native and unfixed chromosomes from mouse 3T3 cells and used tapping and contact mode atomic force microscopy (AFM) to image and manipulate them. Modified AFM tips were used to image chromosomes in contact mode in air, and then the chromosome samples were immobilized on a substrate and placed in a buffer solution to pull out DNA-histone complexes from them after they were optimally treated with trypsin. From the AFM images, we could see several bands and granular structures on chromosomes. We obtained force curves indicating long fiber extensions from native chromosomes both with low (in high concentration of NaCl) and high forces (physiological conditions). The result suggested that the degree of chromosome condensation decreased in high concentration of salt. It agrees with the known fact of histone H1 dissociation in a high concentration of salt. We intend to pull out DNA-histone complexes from chromosomes for later molecular operations on them using an AFM.

  20. AFM Imaging of Mercaptobenzoic Acid on Au(110): Submolecular Contrast with Metal Tips.

    PubMed

    Hauptmann, Nadine; Robles, Roberto; Abufager, Paula; Lorente, Nicolas; Berndt, Richard

    2016-06-01

    A self-assembled monolayer of mercaptobenzoic acid (MBA) on Au(110) is investigated with scanning tunneling and atomic force microscopy (STM and AFM) and density functional calculations. High-resolution AFM images obtained with metallic tips show clear contrasts between oxygen atoms and phenyl moieties. The contrast above the oxygen atoms is due to attractive covalent interactions, which is different than previously reported high-resolution images, where Pauli repulsion dominated the image contrast. We show that the bonding of MBA to the substrate occurs mainly through dispersion interactions, whereas the thiol-Au bond contributes only a quarter of the adsorption energy. No indication of Au adatoms mediating the thiol-Au interaction was found in contrast to other thiol-bonded systems. However, MBA lifts the Au(110)-(2 × 1) reconstruction. PMID:27183144

  1. Novel tip shape reconstruction method for restoration of AFM topography images using nano-structures with given shapes.

    PubMed

    Onishi, Keiko; Fujita, Daisuke

    2011-01-01

    The establishment of more accurate imaging of surface microstructures is needed. The most significant distortion in atomic force microscopy (AFM) imaging is induced by the probe tip shape, whenever the sample surface contains features whose dimensions are comparable to the probe tip size. The acquired AFM image is the dilation between the tip shape and the sample topography. To restore the original topographical profile, a numerical erosion procedure using a precise probe shape function is required. Here, a new technique for reconstruction of probe shape function using a well-defined nanostructure is proposed. First, AFM topography images of the given-shape nanostructure dispersed on flat substrates are taken. Then, a probe shape function is determined by a numerical calculation procedure. By using the experimentally determined probe shape function, the most probable surface morphologies from the observed AFM topography images of unknown samples can be extracted. PMID:21321438

  2. High throughput nanofabrication of silicon nanowire and carbon nanotube tips on AFM probes by stencil-deposited catalysts.

    PubMed

    Engstrom, Daniel S; Savu, Veronica; Zhu, Xueni; Bu, Ian Y Y; Milne, William I; Brugger, Juergen; Boggild, Peter

    2011-04-13

    A new and versatile technique for the wafer scale nanofabrication of silicon nanowire (SiNW) and multiwalled carbon nanotube (MWNT) tips on atomic force microscope (AFM) probes is presented. Catalyst material for the SiNW and MWNT growth was deposited on prefabricated AFM probes using aligned wafer scale nanostencil lithography. Individual vertical SiNWs were grown epitaxially by a catalytic vapor-liquid-solid (VLS) process and MWNTs were grown by a plasma-enhanced chemical vapor (PECVD) process on the AFM probes. The AFM probes were tested for imaging micrometers-deep trenches, where they demonstrated a significantly better performance than commercial high aspect ratio tips. Our method demonstrates a reliable and cost-efficient route toward wafer scale manufacturing of SiNW and MWNT AFM probes. PMID:21446752

  3. Paramagnetic and ferromagnetic resonance imaging with a tip-on-cantilever magnetic resonance force microscope

    NASA Astrophysics Data System (ADS)

    Wago, K.; Botkin, D.; Yannoni, C. S.; Rugar, D.

    1998-05-01

    A magnetic resonance force microscope with a "tip-on-cantilever" configuration was used to compare imaging characteristics of paramagnetic and ferromagnetic samples. Three-dimensional electron paramagnetic resonance (EPR) imaging of diphenylpicrylhydrazil (DPPH) particles was accomplished by scanning the sample in two dimensions while stepping an external field. The EPR force map showed broad response reflecting the size and shape of the sample, allowing a three-dimensional real-space magnetization image to be successfully reconstructed. In contrast to the EPR case, ferromagnetic resonance imaging of a micron-scale yttrium iron garnet sample showed no significant line broadening despite the strong field gradient (˜10 G/μm). Two-dimensional force maps revealed spatial dependence of magnetostatic and magnetoelastic modes.

  4. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  5. Finite element modeling of atomic force microscopy cantilever dynamics during video rate imaging

    SciTech Connect

    Howard-Knight, J. P.; Hobbs, J. K.

    2011-04-01

    A dynamic finite element model has been constructed to simulate the behavior of low spring constant atomic force microscope (AFM) cantilevers used for imaging at high speed without active feedback as in VideoAFM. The model is tested against experimental data collected at 20 frame/s and good agreement is found. The complex dynamics of the cantilever, consisting of traveling waves coming from the tip sample interaction, reflecting off the cantilever-substrate junction, and interfering with new waves created at the tip, are revealed. The construction of the image from this resulting nonequilibrium cantilever deflection is also examined. Transient tip-sample forces are found to reach values up to 260 nN on a calibration grid sample, and the maximum forces do not always correspond to the position of steepest features as a result of energy stored in the cantilever.

  6. Probing the probe: AFM tip-profiling via nanotemplates to determine Hamaker constants from phase-distance curves.

    PubMed

    Rodriguez, Raul D; Lacaze, Emmanuelle; Jupille, Jacques

    2012-10-01

    A method to determine the van der Waals forces from phase-distance curves recorded by atomic force microscopy (AFM) in tapping mode is presented. The relationship between the phase shift and the tip-sample distance is expressed as a function of the product of the Hamaker constant by tip radius. Silica-covered silicon tips are used to probe silica-covered silicon substrate in dry conditions to avoid capillary effects. Tips being assumed spherical, radii are determined in situ by averaging profiles recorded in different directions on hematite nanocrystals acting as nanotemplates, thus accounting for tip anisotropy. Through a series of reproducible measurements performed with tips of various radii (including the in-situ characterization of a damaged tip), a value of (6.3±0.4)×10(-20) J is found for the Hamaker constant of interacting silica surfaces in air, in good agreement with tabulated data. The results demonstrate that the onset of the tip-surface interaction is dominated by the van der Waals forces and that the total force can be modeled in the framework of the harmonic approximation. Based on the tip radius and the Hamaker constant associated to the tip-substrate system, the model is quite flexible. Once the Hamaker constant is known, a direct estimate of the tip size can be achieved whereas when the tip size is known, a quantitative evaluation of the van der Waals force becomes possible on different substrates with a spatial resolution at the nanoscale. PMID:22922181

  7. Graphene sheet versus two-dimensional electron gas: A relativistic Fano spin filter via STM and AFM tips

    NASA Astrophysics Data System (ADS)

    Seridonio, A. C.; Siqueira, E. C.; Souza, F. M.; Machado, R. S.; Lyra, S. S.; Shelykh, I. A.

    2013-11-01

    We explore theoretically the density of states (LDOS) probed by a scanning tunneling microscope (STM) tip of two-dimensional systems hosting an adatom and a subsurface impurity, both capacitively coupled to atomic force microscope (AFM) tips and traversed by antiparallel magnetic fields. Two kinds of setups are analyzed, a monolayer of graphene and a two-dimensional electron gas (2DEG). The AFM tips set the impurity levels at the Fermi energy, where two contrasting behaviors emerge: The Fano factor for the graphene diverges, while in the 2DEG it approaches zero. As result, the spin degeneracy of the LDOS is lifted exclusively in the graphene system, in particular, for the asymmetric regime of Fano interference. The aftermath of this limit is a counterintuitive phenomenon, which consists of a dominant Fano factor due to the subsurface impurity even with a stronger STM-adatom coupling. Thus we find a full polarized conductance, achievable just by displacing vertically the position of the STM tip. Our work proposes the Fano effect as the mechanism to filter spins in graphene. This feature arises from the massless Dirac electrons within the band structure and allows us to employ the graphene host as a relativistic Fano spin filter.

  8. Hydrodynamic effects of the tip movement on surface nanobubbles: a combined tapping mode, lift mode and force volume mode AFM study.

    PubMed

    Walczyk, Wiktoria; Hain, Nicole; Schönherr, Holger

    2014-08-28

    We report on an Atomic Force Microscopy (AFM) study of AFM tip-nanobubble interactions in experiments conducted on argon surface nanobubbles on HOPG (highly oriented pyrolytic graphite) in water in tapping mode, lift mode and Force Volume (FV) mode AFM. By subsequent data acquisition on the same nanobubbles in these three different AFM modes, we could directly compare the effect of different tip-sample interactions. The tip-bubble interaction strength was found to depend on the vertical and horizontal position of the tip on the bubble with respect to the bubble center. The interaction forces measured experimentally were in good agreement with the forces calculated using the dynamic interaction model. The strength of the hydrodynamic effect was also found to depend on the direction of the tip movement. It was more pronounced in the FV mode, in which the tip approaches the bubble from the top, than in the lift mode, in which the tip approaches the bubble from the side. This result suggests that the direction of tip movement influences the bubble deformation. The effect should be taken into account when nanobubbles are analysed by AFM in various scanning modes. PMID:24988375

  9. Improved atomic force microscopy cantilever performance by partial reflective coating.

    PubMed

    Schumacher, Zeno; Miyahara, Yoichi; Aeschimann, Laure; Grütter, Peter

    2015-01-01

    Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. PMID:26199849

  10. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    NASA Astrophysics Data System (ADS)

    Haemmerli, Alexandre J.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David; Pruitt, Beth L.

    2015-07-01

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz-10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  11. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    SciTech Connect

    Haemmerli, Alexandre J.; Pruitt, Beth L.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David

    2015-07-21

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz–10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  12. Large deflections and vibration of a tapered cantilever pulled at its tip by a cable

    NASA Astrophysics Data System (ADS)

    Holland, David B.; Virgin, Lawrence N.; Plaut, Raymond H.

    2008-02-01

    The behavior of a slender, tapered, cantilever beam loaded through a cable attached to its free end is described. Large static deflections are computed (based on an elastica description) together with natural frequencies and mode shapes for small-amplitude vibrations about equilibrium. Experimental results exhibit good agreement with the theoretical results.

  13. Comment on ‘Longest reach of a cantilever with a tip load’

    NASA Astrophysics Data System (ADS)

    Batista, Milan

    2016-09-01

    In this contribution, the longest horizontal reach of a cantilever subject to a dead load is analysed in terms of Jacobi elliptical functions. The problem is reduced to finding the solution of a system of transcendental equations. Several analytical results that cannot be obtained using pure numerical methods are discussed.

  14. Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms.

    PubMed

    Makasheva, K; Villeneuve-Faure, C; Laurent, C; Despax, B; Boudou, L; Teyssedre, G

    2015-07-24

    The study of charge distribution on the surface and in the bulk of dielectrics is of great scientific interest because of the information gained on the storage and transport properties of the medium. Nevertheless, the processes at the nanoscale level remain out of the scope of the commonly used diagnostic methods. Atomic force microscopy (AFM) is currently applied for both injection and imaging of charges on dielectric thin films at the nanoscale level to answer the increasing demand for characterization of miniaturized components used in microelectronics, telecommunications, electrophotography, electrets, etc. However, the mechanisms for dielectric charging by AFM are not well documented, and an analysis of the literature shows that inappropriate mechanisms are sometimes presented. It is shown here that corona discharge, frequently pointed out as a likely mechanism for dielectric charging by AFM in tip-to-sample space mode, cannot develop in such small distances. Furthermore, a review of different mechanisms surmised to be at the origin of dielectric charging at the nanoscale level is offered. Field electron emission enhanced by thermionic emission is identified as a likely mechanism for dielectric charging at the nanoscale level. Experimental validation of this mechanism is obtained for typical electric field strengths in AFM. PMID:26133237

  15. Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms

    NASA Astrophysics Data System (ADS)

    Makasheva, K.; Villeneuve-Faure, C.; Laurent, C.; Despax, B.; Boudou, L.; Teyssedre, G.

    2015-07-01

    The study of charge distribution on the surface and in the bulk of dielectrics is of great scientific interest because of the information gained on the storage and transport properties of the medium. Nevertheless, the processes at the nanoscale level remain out of the scope of the commonly used diagnostic methods. Atomic force microscopy (AFM) is currently applied for both injection and imaging of charges on dielectric thin films at the nanoscale level to answer the increasing demand for characterization of miniaturized components used in microelectronics, telecommunications, electrophotography, electrets, etc. However, the mechanisms for dielectric charging by AFM are not well documented, and an analysis of the literature shows that inappropriate mechanisms are sometimes presented. It is shown here that corona discharge, frequently pointed out as a likely mechanism for dielectric charging by AFM in tip-to-sample space mode, cannot develop in such small distances. Furthermore, a review of different mechanisms surmised to be at the origin of dielectric charging at the nanoscale level is offered. Field electron emission enhanced by thermionic emission is identified as a likely mechanism for dielectric charging at the nanoscale level. Experimental validation of this mechanism is obtained for typical electric field strengths in AFM.

  16. Integrin-specific mechanoresponses to compression and extension probed by cylindrical flat-ended AFM tips in lung cells.

    PubMed

    Acerbi, Irene; Luque, Tomás; Giménez, Alícia; Puig, Marta; Reguart, Noemi; Farré, Ramon; Navajas, Daniel; Alcaraz, Jordi

    2012-01-01

    Cells from lung and other tissues are subjected to forces of opposing directions that are largely transmitted through integrin-mediated adhesions. How cells respond to force bidirectionality remains ill defined. To address this question, we nanofabricated flat-ended cylindrical Atomic Force Microscopy (AFM) tips with ~1 µm(2) cross-section area. Tips were uncoated or coated with either integrin-specific (RGD) or non-specific (RGE/BSA) molecules, brought into contact with lung epithelial cells or fibroblasts for 30 s to form focal adhesion precursors, and used to probe cell resistance to deformation in compression and extension. We found that cell resistance to compression was globally higher than to extension regardless of the tip coating. In contrast, both tip-cell adhesion strength and resistance to compression and extension were the highest when probed at integrin-specific adhesions. These integrin-specific mechanoresponses required an intact actin cytoskeleton, and were dependent on tyrosine phosphatases and Ca(2+) signaling. Cell asymmetric mechanoresponse to compression and extension remained after 5 minutes of tip-cell adhesion, revealing that asymmetric resistance to force directionality is an intrinsic property of lung cells, as in most soft tissues. Our findings provide new insights on how lung cells probe the mechanochemical properties of the microenvironment, an important process for migration, repair and tissue homeostasis. PMID:22384196

  17. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips.

    PubMed

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    This paper deals with an application of 3D finite element analysis to the electrostatic interaction between (i) a commercial rectangular shaped cantilever (with an integrated anisotropic pyramidal tip) and a conductive sample, when a voltage difference is applied between them, and (ii) a focused ion beam (FIB) modified cantilever in order to realize a probe with reduced parasitic electrostatic force. The 3D modelling of their electrostatic deflection was realized by using multiphysics finite element analysis software and applied to the real geometry of the cantilevers and probes as used in conventional electric and Kelvin force microscopy to evaluate the contribution of the various part of a cantilever to the total force, and derive practical criteria to optimize the probe performances. We report also on the simulation of electrostatic shielding of nanometric features, in order to quantitatively evaluate an alternative way of reducing the systematic error caused by the cantilever-to-sample capacitive coupling. Finally, a quantitative comparison between the performances of rectangular and triangular cantilevers (part I of this work) is reported. PMID:21832618

  18. Effect of cantilever nonlinearity in nanoscale tensile testing

    NASA Astrophysics Data System (ADS)

    Ding, Weiqiang; Guo, Zaoyang; Ruoff, Rodney S.

    2007-02-01

    Microcantilevers are widely used in micro-/nanoscale mechanics studies. The nonlinear response of a cantilever at large deflection is sometimes overlooked. A general study of cantilever beam nonlinearity under a variety of loading conditions was performed with analytical and finite element analyses. Analytical equations for the applied load and the cantilever deflection were obtained. The cantilever nonlinearity was found to increase with increasing cantilever deflection and/or angle of loading. Tensile tests were performed on templated carbon nanotubes (TCNTs) with a custom-made nanomanipulator inside a scanning electron microscope. Atomic force microscope (AFM) cantilevers were used to load the TCNTs and sense the force. During the tests the AFM cantilevers were loaded to relatively large deflections with nonvertical loads applied at the AFM tip. Based on the slope and the loading angle measurements, the breaking forces of the TCNTs were obtained through numerical integration of the analytical equations. A comparison was made between the load results obtained from linear and nonlinear analyses. The linear analysis was found to underestimate the applied load by up to 15%.

  19. In-situ piezoresponse force microscopy cantilever mode shape profiling

    SciTech Connect

    Proksch, R.

    2015-08-21

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  20. Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting

    NASA Astrophysics Data System (ADS)

    Sang, Hongqian; Jarvis, Samuel P.; Zhou, Zhichao; Sharp, Peter; Moriarty, Philip; Wang, Jianbo; Wang, Yu; Kantorovich, Lev

    2014-10-01

    A practical experimental strategy is proposed that could potentially enable greater control of the tip apex in non-contact atomic force microscopy experiments. It is based on a preparation of a structure of interest alongside a reference surface reconstruction on the same sample. Our proposed strategy is as follows. Spectroscopy measurements are first performed on the reference surface to identify the tip apex structure using a previously collected database of responses of different tips to this surface. Next, immediately following the tip identification protocol, the surface of interest is studied (imaging, manipulation and/or spectroscopy). The prototype system we choose is the mixed Si(111)-7×7 and surface which can be prepared on the same sample with a controlled ratio of reactive and passivated regions. Using an ``in silico'' approach based on ab initio density functional calculations and a set of tips with varying chemical reactivities, we show how one can perform tip fingerprinting using the Si(111)-7×7 reference surface. Then it is found by examining the imaging of a naphthalene tetracarboxylic diimide (NTCDI) molecule adsorbed on surface that negatively charged tips produce the best intramolecular contrast attributed to the enhancement of repulsive interactions.

  1. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect

    Balantekin, M.; Satır, S.; Torello, D.; Değertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  2. Imaging resolution of AFM with probes modified with FIB.

    PubMed

    Skibinski, J; Rebis, J; Wejrzanowski, T; Rozniatowski, K; Pressard, K; Kurzydlowski, K J

    2014-11-01

    This study concerns imaging of the structure of materials using AFM tapping (TM) and phase imaging (PI) mode, using probes modified with focused ion beam (FIB). Three kinds of modifications were applied - thinning of the cantilever, sharpening of the tip and combination of these two modifications. Probes shaped in that way were used for AFM investigations with Bruker AFM Nanoscope 8. As a testing material, titanium roughness standard supplied by Bruker was used. The results show that performed modifications influence the oscillation of the probes. In particular thinning of the cantilever enables one to acquire higher self-resonant frequencies, which can be advantageous for improving the quality of imaging in PI mode. It was found that sharpening the tip improves imaging resolution in tapping mode, which is consistent with existing knowledge, but lowered the quality of high frequency topography images. In this paper the Finite Element Method (FEM) was used to explain the results obtained experimentally. PMID:25080273

  3. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips

    NASA Astrophysics Data System (ADS)

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    The investigation of the nanoscale distribution of electrostatic forces on material surfaces is of paramount importance for the development of nanotechnology, since these confined forces govern many physical processes on which a large number of technological applications are based. For instance, electric force microscopy (EFM) and micro-electro-mechanical-systems (MEMS) are technologies based on an electrostatic interaction between a cantilever and a specimen. In the present work we report on a 3D finite element analysis of the electrostatic deflection of cantilevers for electric and Kelvin force microscopy. A commercial triangular shaped cantilever with a symmetric pyramidal tip was modelled. In addition, the cantilever was modified by a focused ion beam (FIB) in order to reduce its parasitic electrostatic force, and its behaviour was studied by computation analysis. 3D modelling of the electrostatic deflection was realized by using a multiphysics finite element analysis software and it was applied to the real geometry of the cantilevers and probes obtained by using basic CAD tools. The results of the modelling are in good agreement with experimental data.

  4. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips.

    PubMed

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    The investigation of the nanoscale distribution of electrostatic forces on material surfaces is of paramount importance for the development of nanotechnology, since these confined forces govern many physical processes on which a large number of technological applications are based. For instance, electric force microscopy (EFM) and micro-electro-mechanical-systems (MEMS) are technologies based on an electrostatic interaction between a cantilever and a specimen. In the present work we report on a 3D finite element analysis of the electrostatic deflection of cantilevers for electric and Kelvin force microscopy. A commercial triangular shaped cantilever with a symmetric pyramidal tip was modelled. In addition, the cantilever was modified by a focused ion beam (FIB) in order to reduce its parasitic electrostatic force, and its behaviour was studied by computation analysis. 3D modelling of the electrostatic deflection was realized by using a multiphysics finite element analysis software and it was applied to the real geometry of the cantilevers and probes obtained by using basic CAD tools. The results of the modelling are in good agreement with experimental data. PMID:21832617

  5. Accurate flexural spring constant calibration of colloid probe cantilevers using scanning laser Doppler vibrometry

    NASA Astrophysics Data System (ADS)

    Gates, Richard S.; Osborn, William A.; Shaw, Gordon A.

    2015-06-01

    Calibration of the flexural spring constant for atomic force microscope (AFM) colloid probe cantilevers provides significant challenges. The presence of a large attached spherical added mass complicates many of the more common calibration techniques such as reference cantilever, Sader, and added mass. Even the most promising option, AFM thermal calibration, can encounter difficulties during the optical lever sensitivity measurement due to strong adhesion and friction between the sphere and a surface. This may cause buckling of the end of the cantilever and hysteresis in the approach-retract curves resulting in increased uncertainty in the calibration. Most recently, a laser Doppler vibrometry thermal method has been used to accurately calibrate the normal spring constant of a wide variety of tipped and tipless commercial cantilevers. This paper describes a variant of the technique, scanning laser Doppler vibrometry, optimized for colloid probe cantilevers and capable of spring constant calibration uncertainties near ±1%.

  6. Piezoelectric cantilever sensors

    NASA Technical Reports Server (NTRS)

    Shih, Wan Y. (Inventor); Shih, Wei-Heng (Inventor); Shen, Zuyan (Inventor)

    2008-01-01

    A piezoelectric cantilever with a non-piezoelectric, or piezoelectric tip useful as mass and viscosity sensors. The change in the cantilever mass can be accurately quantified by monitoring a resonance frequency shift of the cantilever. For bio-detection, antibodies or other specific receptors of target antigens may be immobilized on the cantilever surface, preferably on the non-piezoelectric tip. For chemical detection, high surface-area selective absorbent materials are coated on the cantilever tip. Binding of the target antigens or analytes to the cantilever surface increases the cantilever mass. Detection of target antigens or analytes is achieved by monitoring the cantilever's resonance frequency and determining the resonance frequency shift that is due to the mass of the adsorbed target antigens on the cantilever surface. The use of a piezoelectric unimorph cantilever allows both electrical actuation and electrical sensing. Incorporating a non-piezoelectric tip (14) enhances the sensitivity of the sensor. In addition, the piezoelectric cantilever can withstand damping in highly viscous liquids and can be used as a viscosity sensor in wide viscosity range.

  7. Large-Scale Fabrication of Carbon Nanotube Probe Tips For Atomic Force Microscopy Critical Dimension Imaging Applications

    NASA Technical Reports Server (NTRS)

    Ye, Qi Laura; Cassell, Alan M.; Stevens, Ramsey M.; Meyyappan, Meyya; Li, Jun; Han, Jie; Liu, Hongbing; Chao, Gordon

    2004-01-01

    Carbon nanotube (CNT) probe tips for atomic force microscopy (AFM) offer several advantages over Si/Si3N4 probe tips, including improved resolution, shape, and mechanical properties. This viewgraph presentation discusses these advantages, and the drawbacks of existing methods for fabricating CNT probe tips for AFM. The presentation introduces a bottom up wafer scale fabrication method for CNT probe tips which integrates catalyst nanopatterning and nanomaterials synthesis with traditional silicon cantilever microfabrication technology. This method makes mass production of CNT AFM probe tips feasible, and can be applied to the fabrication of other nanodevices with CNT elements.

  8. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid.

    PubMed

    Miyazawa, K; Izumi, H; Watanabe-Nakayama, T; Asakawa, H; Fukuma, T

    2015-03-13

    Recently, possibilities of improving operation speed and force sensitivity in atomic-scale atomic force microscopy (AFM) in liquid using a small cantilever with an electron beam deposited (EBD) tip have been intensively explored. However, the structure and properties of an EBD tip suitable for such an application have not been well-understood and hence its fabrication process has not been established. In this study, we perform atomic-scale AFM measurements with a small cantilever and clarify two major problems: contaminations from a cantilever and tip surface, and insufficient mechanical strength of an EBD tip having a high aspect ratio. To solve these problems, here we propose a fabrication process of an EBD tip, where we attach a 2 μm silica bead at the cantilever end and fabricate a 500-700 nm EBD tip on the bead. The bead height ensures sufficient cantilever-sample distance and enables to suppress long-range interaction between them even with a short EBD tip having high mechanical strength. After the tip fabrication, we coat the whole cantilever and tip surface with Si (30 nm) to prevent the generation of contamination. We perform atomic-scale AFM imaging and hydration force measurements at a mica-water interface using the fabricated tip and demonstrate its applicability to such an atomic-scale application. With a repeated use of the proposed process, we can reuse a small cantilever for atomic-scale measurements for several times. Therefore, the proposed method solves the two major problems and enables the practical use of a small cantilever in atomic-scale studies on various solid-liquid interfacial phenomena. PMID:25697199

  9. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition

    SciTech Connect

    Kinoshita, Yukinori; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2011-11-15

    Tungsten (W) is significantly suitable as a tip material for atomic force microscopy (AFM) because its high mechanical stiffness enables the stable detection of tip-sample interaction forces. We have developed W sputter-coating equipment to compensate the drawbacks of conventional Si cantilever tips used in AFM measurements. By employing an ion gun commonly used for sputter cleaning of a cantilever tip, the equipment is capable of depositing conductive W films in the preparation chamber of a general ultrahigh vacuum (UHV)-AFM system without the need for an additional chamber or transfer system. This enables W coating of a cantilever tip immediately after sputter cleaning of the tip apex and just before the use in AFM observations. The W film consists of grain structures, which prevent tip dulling and provide sharpness (<3 nm in radius of curvature at the apex) comparable to that of the original Si tip apex. We demonstrate that in non-contact (NC)-AFM measurement, a W-coated Si tip can clearly resolve the atomic structures of a Ge(001) surface without any artifacts, indicating that, as a force sensor, the fabricated W-coated Si tip is superior to a bare Si tip.

  10. Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy.

    PubMed

    Deng, Wenqi; Zhang, Guang-Ming; Murphy, Mark F; Lilley, Francis; Harvey, David M; Burton, David R

    2015-10-01

    Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behavior of tapping mode AFM has been investigated using mathematical modeling, comprehensive understanding of the behavior of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever's dynamic behavior in tapping mode AFM is studied through a three dimensional finite element method. The cantilever's dynamic displacement responses are firstly obtained via simulation under different tip-sample separations, and for different tip-sample interaction forces, such as elastic force, adhesion force, viscosity force, and the van der Waals force, which correspond to the cantilever's action upon various different representative computer-generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone, and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude, and frequency changes are then analyzed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations. PMID:26303510

  11. Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

    PubMed Central

    2013-01-01

    Abstract A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS 07.79.Lh, 81.16.-c, 84.37. + q PMID:24314111

  12. Solid-state SiO2 nano-gears AFM tip manipulation on HOPG

    NASA Astrophysics Data System (ADS)

    Yang, Jianshu; Deng, Jie; Troadec, Cedic; Ondarçuhu, Thierry; Joachim, Christian

    2014-11-01

    On a native graphite surface, 15 nm-thick solid-state nanogears are nanofabricated with a 30 nm outer diameter and six teeth. The nanogears are manipulated one at a time by the tip of an atomic force microscope using the sample stage displacements for the manipulation and recording of the corresponding manipulation signals. For step heights below 3.0 nm, nanogears are manipulated up and down native graphite surface step edges. In the absence of a central shaft per nanogear, gearing between nanogears is limited to a few 1/12 turns for six teeth. When the graphite step is higher than 3 nm, a rack-and-pinion mechanism was constructed along the edge with a 90 nm nanogear pinion.

  13. Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner.

    PubMed

    Lu, Lu; Xu, Song; Zhang, Donghui; Garno, Jayne C

    2016-02-15

    Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information. The FMM mode is useful for investigations with polymer and organic thin film samples. Qualitative evaluation of the mixed domains of co-polymers or composite films can often be accomplished with high resolution using FMM phase and amplitude images. We have designed and tested a sample stage for FMM constructed of machined polycarbonate. A generic design enables FMM experiments for instrument configurations with a tip-mounted SPM scanner. A piezoactuator within the sample stage was used to drive the sample to vibrate in the z-direction according to selected parameters. To evaluate the FMM sample stage, we tested samples of known composition with nanoscale dimensions for increasingly complex surface morphologies. Excellent resolution was achieved in ambient conditions using the home-constructed sample stage, as revealed for complex surfaces or multi-component samples. Test structures of nanoholes within a film of organosilanes provided the simplest platform with two distinct surface domains. Ring-shaped nanostructures prepared on Si(111) with mixed organosilanes provided three regions for evaluating FMM results. A complex sample consisting of a cyclic gel polymer containing fibril nanostructures was also tested with FMM measurements. Frequency spectra were acquired for sample domains, revealing distinct differences in local mechanical response. We demonstrate a practical approach to construct a sample stage accessory to facilitate z-sample modulation for FMM experiments with tip-mounted SPM scanners. PMID:26824091

  14. Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies.

    PubMed

    Fukuma, T; Onishi, K; Kobayashi, N; Matsuki, A; Asakawa, H

    2012-04-01

    In this study, we have investigated the performance of liquid-environment FM-AFM with various cantilevers having different dimensions from theoretical and experimental aspects. The results show that reduction of the cantilever dimensions provides improvement in the minimum detectable force as long as the tip height is sufficiently long compared with the width of the cantilever. However, we also found two important issues to be overcome to achieve this theoretically expected performance. The stable photothermal excitation of a small cantilever requires much higher pointing stability of the exciting laser beam than that for a long cantilever. We present a way to satisfy this stringent requirement using a temperature controlled laser diode module and a polarization-maintaining optical fiber. Another issue is associated with the tip. While a small carbon tip formed by electron beam deposition (EBD) is desirable for small cantilevers, we found that an EBD tip is not suitable for atomic-scale applications due to the weak tip-sample interaction. Here we show that the tip-sample interaction can be greatly enhanced by coating the tip with Si. With these improvements, we demonstrate atomic-resolution imaging of mica in liquid using a small cantilever with a megahertz-order resonance frequency. In addition, we experimentally demonstrate the improvement in the minimum detectable force obtained by the small cantilever in measurements of oscillatory hydration forces. PMID:22421199

  15. Mode coupling in a hanging-fiber AFM used as a rheological probe

    NASA Astrophysics Data System (ADS)

    Devailly, C.; Laurent, J.; Steinberger, A.; Bellon, L.; Ciliberto, S.

    2014-06-01

    We analyze the advantages and drawbacks of a method which measures the viscosity of liquids at microscales, using a thin glass fiber fixed on the tip of a cantilever of an ultra-low-noise Atomic Force Microscope (AFM). When the fiber is dipped into a liquid, the dissipation of the cantilever-fiber system, which is linked to the liquid viscosity, can be computed from the power spectral density of the thermal fluctuations of the cantilever deflection. The high sensitivity of the AFM allows us to show the existence and to develop a model of the coupling between the dynamics of the fiber and that of the cantilever. This model, which accurately fits the experimental data, gives also more insights into the dynamics of coupled microdevices in a viscous environment.

  16. A direct micropipette-based calibration method for atomic force microscope cantilevers

    PubMed Central

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes. PMID:19566228

  17. A silicon cantilever probe card with tip-to-pad electric feed-through and automatic isolation of the metal coating

    NASA Astrophysics Data System (ADS)

    Wang, Fei; Li, Xinxin; Guo, Nanxiang; Wang, Yuelin; Feng, Songlin

    2006-07-01

    A new microfabrication technology for a silicon cantilever array probe card is developed, with technical requirements from Sino IC Technology Co. Ltd for dies under test of 8 inch wafers. A probe card consisting of 96 silicon probes for simultaneously testing two dies is designed and fabricated with bulk micromachining technologies. According to the requirements, a probing force of 25 mN is designed for over-drive displacement no lower than 20 µm. By using a double-sided metal overlapping scheme, electric feed-through is realized from the probe tips at the bottom to the automatic testing equipment interface on the topside. A recessed concave step is designed and formed to automatically isolate the adjacent probes when a conductive metal layer is sputtered on the surface of the cantilever tips. Characterization of the probe card shows that the resistance at the feed-through via holes is generally lower than 0.8 Ω. In addition, the parasitic capacitance between adjacent probes is as low as 0.02-0.03 pF. The spring constant of the cantilevers is measured as 1126.8 N m-1, which agrees well with the design.

  18. AFM nanoscale indentation in air of polymeric and hybrid materials with highly different stiffness

    NASA Astrophysics Data System (ADS)

    Suriano, Raffaella; Credi, Caterina; Levi, Marinella; Turri, Stefano

    2014-08-01

    In this study, nanomechanical properties of a variety of polymeric materials was investigated by means of AFM. In particular, selecting different AFM probes, poly(methyl methacrylate) (PMMA), polydimethylsiloxane (PDMS) bulk samples, sol-gel hybrid thin films and hydrated hyaluronic acid hydrogels were indented in air to determine the elastic modulus. The force-distance curves and the indentation data were found to be greatly affected by the cantilever stiffness and by tip geometry. AFM indentation tests show that the choice of the cantilever spring constant and of tip shape is crucially influenced by elastic properties of samples. When adhesion-dominated interactions occur between the tip and the surface of samples, force-displacement curves reveal that a suitable functionalization of AFM probes allows the control of such interactions and the extraction of Young' modulus from AFM curves that would be otherwise unfeasible. By applying different mathematical models depending on AFM probes and materials under investigation, the values of Young's modulus were obtained and compared to those measured by rheological and dynamic mechanical analysis or to literature data. Our results show that a wide range of elastic moduli (10 kPa-10 GPa) can be determined by AFM in good agreement with those measured by conventional macroscopic measurements.

  19. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process

    NASA Astrophysics Data System (ADS)

    Villeneuve-Faure, C.; Makasheva, K.; Boudou, L.; Teyssedre, G.

    2016-06-01

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms.

  20. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process.

    PubMed

    Villeneuve-Faure, C; Makasheva, K; Boudou, L; Teyssedre, G

    2016-06-17

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms. PMID:27158768

  1. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

    SciTech Connect

    Gates, Richard S.; Reitsma, Mark G.

    2007-08-15

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  2. Viscous drag measurements utilizing microfabricated cantilevers

    SciTech Connect

    Oden, P.I.; Chen, G.Y.; Steele, R.A.; Warmack, R.J.; Thundat, T.

    1996-06-01

    The influence of viscous drag forces on cantilevers is investigated using standard atomic force microscope (AFM) cantilevers. Viscosity effects on several geometrically different cantilevers manifest themselves as variations in resonance frequencies, quality factors, and cantilever response amplitudes. With this novel measurement, a single cantilever can be used to measure viscosities ranging from {eta}=10{sup {minus}2} to 10{sup 2} g/cms. {copyright} {ital 1996 American Institute of Physics.}

  3. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model. PMID:27420398

  4. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever

    NASA Astrophysics Data System (ADS)

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M.

    2016-09-01

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  5. Nanoscale thermal processing using a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Nelson, Brent A.

    This dissertation aims to advance the current state of use of silicon atomic force microscope (AFM) cantilevers with integrated heaters. To this end, the research consists of two primary thrusts---demonstrating new applications for the cantilevers, and advancing the current state of understanding of their thermal and mechanical behavior to enable further applications. Among new applications, two are described. In the first application, the cantilevers are used for nanoscale material deposition, using heat to modulate the delivery of material from the nanoscale tip. In the second application, the cantilever performs thermal analysis with nanoscale spatial resolution, enabling thermal characterization of near surface and composite interphase regions that cannot be measured with bulk analysis techniques. The second thrust of the research seeks to address fundamental questions concerning the precision use of heated cantilevers. Efforts to this end include characterizing the mechanical, electrical, and thermal behavior of the cantilevers, and optimizing calibration methodology. A technique is developed for calibrating the cantilever spring constant while operating at elevated temperature. Finally, an analytical model is developed for the heat flow in the cantilever tip and relevant dimensionless numbers that govern the relative importance of the various components of the thermal environment are identified. The dimensionless numbers permit exploration of the sensitivity of the tip-substrate interface temperature to the environmental conditions.

  6. Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi

    2016-08-01

    In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. Both optical and mechanical detection techniques were adopted in SNOM to detect scattered light induced by the interaction of the PZT cantilever tip apex and evanescent light, and SNOM images were obtained for each detection scheme. The mechanical detection technique did allow for a clear observation of the light scattered from the PZT cantilever without the interference observed by the optical detection technique, which used an objective lens, a pinhole, and a photomultiplier tube.

  7. Control of curvature in highly compliant probe cantilevers during carbon nanotube growth.

    PubMed

    Chen, I-Chen; Chen, Li-Han; Orme, Christine A; Jin, Sungho

    2007-10-01

    Direct growth of a sharp carbon nanotube (CNT) probe on a very thin and highly flexible cantilever by plasma-enhanced chemical vapor deposition (PECVD) is desirable for atomic force microscopy (AFM) of nanoscale features on soft or fragile materials. Plasma-induced surface stresses in such fabrication processes, however, tend to cause serious bending of these cantilevers, which makes the CNT probe unsuitable for AFM measurements. Here, we report a new tunable CNT growth technique that controls cantilever bending during deposition, thereby enabling the creation of either flat or deliberately curved AFM cantilevers containing a CNT probe. By introducing hydrogen gas to the (acetylene + ammonia) feed gas during CNT growth and adjusting the ammonia to hydrogen flow ratio, the cantilever surface stress can be altered from compressive to tensile stress, and in doing so controlling the degree of cantilever bending. The CNT probes grown under these conditions have high aspect ratios and are robust. Contact-mode imaging has been demonstrated using these probe tips. Such CNT probes can be useful for bio-imaging involving DNA and other delicate biological features in a liquid environment. PMID:17887798

  8. Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes.

    PubMed

    Smirnov, Waldemar; Kriele, Armin; Hoffmann, René; Sillero, Eugenio; Hees, Jakob; Williams, Oliver A; Yang, Nianjun; Kranz, Christine; Nebel, Christoph E

    2011-06-15

    In atomic force microscopy (AFM), sharp and wear-resistant tips are a critical issue. Regarding scanning electrochemical microscopy (SECM), electrodes are required to be mechanically and chemically stable. Diamond is the perfect candidate for both AFM probes as well as for electrode materials if doped, due to diamond's unrivaled mechanical, chemical, and electrochemical properties. In this study, standard AFM tips were overgrown with typically 300 nm thick nanocrystalline diamond (NCD) layers and modified to obtain ultra sharp diamond nanowire-based AFM probes and probes that were used for combined AFM-SECM measurements based on integrated boron-doped conductive diamond electrodes. Analysis of the resonance properties of the diamond overgrown AFM cantilevers showed increasing resonance frequencies with increasing diamond coating thicknesses (i.e., from 160 to 260 kHz). The measured data were compared to performed simulations and show excellent correlation. A strong enhancement of the quality factor upon overgrowth was also observed (120 to 710). AFM tips with integrated diamond nanowires are shown to have apex radii as small as 5 nm and where fabricated by selectively etching diamond in a plasma etching process using self-organized metal nanomasks. These scanning tips showed superior imaging performance as compared to standard Si-tips or commercially available diamond-coated tips. The high imaging resolution and low tip wear are demonstrated using tapping and contact mode AFM measurements by imaging ultra hard substrates and DNA. Furthermore, AFM probes were coated with conductive boron-doped and insulating diamond layers to achieve bifunctional AFM-SECM probes. For this, focused ion beam (FIB) technology was used to expose the boron-doped diamond as a recessed electrode near the apex of the scanning tip. Such a modified probe was used to perform proof-of-concept AFM-SECM measurements. The results show that high-quality diamond probes can be fabricated, which are

  9. Cantilevered carbon nanotube hygrometer

    NASA Astrophysics Data System (ADS)

    Kuroyanagi, Toshinori; Terada, Yuki; Takei, Kuniharu; Akita, Seiji; Arie, Takayuki

    2014-05-01

    We investigate the effects of humidity on the vibrations of carbon nanotubes (CNTs) using two types of CNT cantilevers: open-ended and close-ended CNT cantilevers. As the humidity increases, the resonant frequency of the open-ended CNT cantilever decreases due to the adsorption of water molecules onto the CNT tip, whereas that of the close-ended CNT cantilever increases probably due to the change in the viscosity of the air surrounding the CNT cantilever, which is negatively correlated with the humidity of air. Our findings suggest that a close-ended CNT cantilever is more suitable for a quick-response and ultrasensitive hygrometer because it continuously reads the viscosity change of moist air in the vicinity of the CNT.

  10. Nano-structure fabrication of GaAs using AFM tip-induced local oxidation method: different doping types and plane orientations

    PubMed Central

    2011-01-01

    In this study, we have fabricated nano-scaled oxide structures on GaAs substrates that are doped in different conductivity types of p- and n-types and plane orientations of GaAs(100) and GaAs(711), respectively, using an atomic force microscopy (AFM) tip-induced local oxidation method. The AFM-induced GaAs oxide patterns were obtained by varying applied bias from approximately 5 V to approximately 15 V and the tip loading forces from 60 to 180 nN. During the local oxidation, the humidity and the tip scan speed are fixed to approximately 45% and approximately 6.3 μm/s, respectively. The local oxidation rate is further improved in p-type GaAs compared to n-type GaAs substrates whereas the rate is enhanced in GaAs(100) compared to and GaAs(711), respectively, under the identical conditions. In addition, the oxide formation mechanisms in different doping types and plane orientations were investigated and compared with two-dimensional simulation results. PMID:21978373

  11. Development of a new generation of active AFM tools for applications in liquids

    NASA Astrophysics Data System (ADS)

    Rollier, A.-S.; Jenkins, D.; Dogheche, E.; Legrand, B.; Faucher, M.; Buchaillot, L.

    2010-08-01

    Atomic force microscopy (AFM) is a powerful imaging tool with high-resolution imaging capability. AFM probes consist of a very sharp tip at the end of a silicon cantilever that can respond to surface artefacts to produce an image of the topography or surface features. They are intrinsically passive devices. For imaging soft biological samples, and also for samples in liquid, it is essential to control the AFM tip position, both statically and dynamically, and this is not possible using external actuators mounted on the AFM chip. AFM cantilevers have been fabricated using silicon micromachining to incorporate a piezoelectric thin film actuator for precise control. The piezoelectric thin films have been fully characterized to determine their actuation performance and to characterize the operation of the integrated device. Examples of the spatial and vertical response are presented to illustrate their imaging capability. For operation in a liquid environment, the dynamic behaviour has been modelled and verified experimentally. The optimal drive conditions for the cantilever, along with their dynamic response, including frequency and phase in air and water, are presented.

  12. Carbon nanotube/carbon nanotube composite AFM probes prepared using ion flux molding

    NASA Astrophysics Data System (ADS)

    Chesmore, Grace; Roque, Carrollyn; Barber, Richard

    The performance of carbon nanotube-carbon nanotube composite (CNT/CNT composite) atomic force microscopy (AFM) probes is compared to that of conventional Si probes in AFM tapping mode. The ion flux molding (IFM) process, aiming an ion beam at the CNT probe, aligns the tip to a desired angle. The result is a relatively rigid tip that is oriented to offset the cantilever angle. Scans using these probes reveal an improvement in image accuracy over conventional tips, while allowing higher aspect ratio imaging of 3D surface features. Furthermore, the lifetimes of CNT-CNT composite tips are observed to be longer than both conventional tips and those claimed for other CNT technologies. Novel applications include the imaging of embiid silk. Supported by the Clare Boothe Luce Research Scholars Award and Carbon Design Innovations.

  13. Atomic Force Microscopy in Dynamic Mode with Displacement Current Detection in Double Cantilever Devices

    NASA Astrophysics Data System (ADS)

    Müller, Falk; Müller, Anne‑Dorothea; Hietschold, Michael; Gessner, Thomas

    2006-03-01

    A cantilever array for dynamic mode atomic force microscopy (AFM) is presented, the vertical displacement of which is analyzed by the detection of displacement currents in the electrodes. Each cantilever in the array consists of an actuation part that allows an independent vertical movement, and a sensor part. The lateral distance between the tips of the different cantilevers is fixed to 10 μm. When operated as an actuator, a voltage is applied between the silicon membrane and the underlaying electrode. Due to the resulting coulomb forces, the vertical position of the tip is controllable. The reaction time in this mode is shorter than the response time of a piezostack. The sensor part, on the other hand, allows the device to work in dynamic mode without a laser deflection system. The vertical resolution achieved is below 1 nm. The dependence of force distance curves on the excitation amplitude is shown.

  14. Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy

    SciTech Connect

    Liu Yu; Guo Qiuquan; Nie Hengyong; Lau, W. M.; Yang Jun

    2009-12-15

    The mechanism of dynamic force modes has been successfully applied to many atomic force microscopy (AFM) applications, such as tapping mode and phase imaging. The high-order flexural vibration modes are recent advancement of AFM dynamic force modes. AFM optical lever detection sensitivity plays a major role in dynamic force modes because it determines the accuracy in mapping surface morphology, distinguishing various tip-surface interactions, and measuring the strength of the tip-surface interactions. In this work, we have analyzed optimization and calibration of the optical lever detection sensitivity for an AFM cantilever-tip ensemble vibrating in high-order flexural modes and simultaneously experiencing a wide range and variety of tip-sample interactions. It is found that the optimal detection sensitivity depends on the vibration mode, the ratio of the force constant of tip-sample interactions to the cantilever stiffness, as well as the incident laser spot size and its location on the cantilever. It is also found that the optimal detection sensitivity is less dependent on the strength of tip-sample interactions for high-order flexural modes relative to the fundamental mode, i.e., tapping mode. When the force constant of tip-sample interactions significantly exceeds the cantilever stiffness, the optimal detection sensitivity occurs only when the laser spot locates at a certain distance from the cantilever-tip end. Thus, in addition to the 'globally optimized detection sensitivity', the 'tip optimized detection sensitivity' is also determined. Finally, we have proposed a calibration method to determine the actual AFM detection sensitivity in high-order flexural vibration modes against the static end-load sensitivity that is obtained traditionally by measuring a force-distance curve on a hard substrate in the contact mode.

  15. Laser-induced thermal expansion of a scanning tunneling microscope tip measured with an atomic force microscope cantilever

    NASA Astrophysics Data System (ADS)

    Huber, R.; Koch, M.; Feldmann, J.

    1998-10-01

    We investigate the transient thermal expansion of a scanning tunneling microscope tip after excitation with intense femtosecond laser pulses. The expansion dynamics are measured electrically by monitoring the time-resolved tunneling current and mechanically by use of an atomic force microscope. The tip expansion reaches values as high as 15 nm and exceeds the typical working distance of a scanning tunneling microscope by far. This results in a mechanical contact between tunneling tip and surface leading to surface modifications on a nanometer scale. Our findings clarify the mechanism of the recently proposed focusing of laser radiation in the near field of a tip technique [J. Jersch and K. Dickmann, Appl. Phys. Lett. 68, 868 (1996)] for nanostructuring.

  16. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

    PubMed Central

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-01-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson’s ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. PMID:26510769

  17. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    PubMed

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-01-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. PMID:26510769

  18. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson’s ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  19. Ultrasharp high-aspect-ratio probe array for SECM and AFM Analysis

    NASA Astrophysics Data System (ADS)

    Tao, Ye; Fasching, Rainer J.; Prinz, Fritz B.

    2004-07-01

    A powerful experimental tool, ultra-sharp nano-electrode array is designed, fabricated and characterized. The application on a combination of Scanning Electrochemical Microscopy (SECM) and the Atomic Force Microcopy (AFM) is demonstrated. It can measure sample electrochemically initiated by SECM changes of topography while detecting topography using AFM. In order to realize this, a specialized probe system that is composed of a micro-mechanical bending structure necessary for the AFM mode and an electrochemical UME-tip required for a high performance SECM is crucial. The probe array is a row of silicon transducers embedded in silicon nitride cantilever array. The sharp high-aspect ratio (20:1) silicon tips are shaped and a thin layer of silicon nitride is deposited, which embeds the silicon tips in a silicon nitride layer so that they protrude through the nitride. Thus, the embedded silicon tips with a diameter less than 600 nm, the top radius less than 20 nm, and the aspect ratio as high as 20 can be achieved. A metal layer and an insulator layer are deposited on these tip structures to make each probe selectively conductive. Finally, cantilever structures are shaped and released by etching the silicon substrate from the backside. Electrochemical and impedance spectroscopic characterization show electrochemical functionality of the transducer system.

  20. Enhanced functionality of nanotube modified atomic force microscopy tips.

    NASA Astrophysics Data System (ADS)

    Patil, Amol; Rinzler, Andrew G.

    2003-03-01

    Nanotube modified atomic force microscopy tips have demonstrated advantages in reduced tip wear, imaging with high resolution, and imaging of deep topographic features. We have further enhanced the utility and functionality of nanotube modified AFM tips by the application of a variety of coatings to these probes. Such coatings stabilize the nanotubes against Euler buckling and make the binding of the nanotubes to the AFM cantilevers extremely robust (even contact mode imaging becomes possible). In terms of new functionality, magnetic metal coating permits their use as improved resolution, magnetic force microscopy probes, while insulating coatings (with the coating removed from the very tip) should permit their use in scanning electrochemical microscopy (with anticipated applications in bio-electrochemistry). We will discuss the coating methods used and the tip exposure processes developed for the latter applications.

  1. Selective nano-patterning of graphene using a heated atomic force microscope tip

    SciTech Connect

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-15

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

  2. Steering the Self-Assembly of Octadecylamine Monolayers on Mica by Controlled Mechanical Energy Transfer from the AFM Tip

    SciTech Connect

    Benitez, J.J.; Heredia-Guerrero, J.A.; Salmeron, M.

    2010-06-24

    We have studied the effect of mechanical energy transfer from the tip of an Atomic Force Microscope on the dynamics of self-assembly of monolayer films of octadecylamine on mica. The formation of the self-assembled film proceeds in two successive stages, the first being a fast adsorption from solution that follows a Langmuir isotherm. The second is a slower process of island growth by aggregation of the molecules dispersed on the surface. We found that the dynamics of aggregation can be altered substantially by the addition of mechanical energy into the system through controlled tip-surface interactions. This leads to either the creation of pinholes in existing islands as a consequence of vacancy concentration, and to the assembly of residual molecules into more compact islands.

  3. Tip characterizer for atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Itoh, Hiroshi; Fujimoto, Toshiyuki; Ichimura, Shingo

    2006-10-01

    A tip characterizer for atomic force microscopy (AFM) was developed based on the fabrication of multilayer thin films. Comb-shaped line and space (LS) and wedge-shaped knife-edge structures were fabricated on a GaAs substrate. GaAs /InGaP superlattices were used to control the width of the structures precisely, and selective chemical etching was used to form sharp edges on the nanostructures. The minimum size of the LS structure was designed to be 10nm, and the radius of the knife edge was less than 5nm. These nanostructures were used as a well-defined tip characterizer to measure the shape of a tip on a cantilever from line profiles of AFM images.

  4. Tip-based nanomanufacturing and metrology of heterogeneous nanostructures

    NASA Astrophysics Data System (ADS)

    Felts, Jonathan R.

    This dissertation presents controlled fabrication and chemical identification of heterogeneous nanostructures using atomic force microscope (AFM) cantilevers. Fabrication and integration of different chemical structures at the nanometer scale is essential for constructing the next generation of electrical, optical, and biological devices. The polymer nanostructures are fabricated using thermal dip pen nanolithography (tDPN), and are characterized using atomic force microscope infrared spectroscopy (AFM-IR). In tDPN, the heated tip of an atomic force microscope cantilever deposits polymer nanostructures onto a surface, where the cantilever heating controls the deposition rate. The nanometer-scale polymer transport between the tip and surface is investigated by controlling tip temperature and substrate temperature over the range 100 -- 260 °C, and for different tip speeds and heating times. It is found that thermal Marangoni forces and non-equilibrium wetting govern the nanometer-scale polymer flow, and that the polymer viscosity governs the mass flow rate. Polymer nanostructures are then characterized by AFM-IR. Nanostructures of polyethylene, polystyrene, and poly(3-dodecylthiophene-2,5-diyl) are fabricated with heights between 100 -- 1000 nm, and find that AFM-IR can measure quantitative IR absorption spectra for structures as small as 100 nm with lateral spatial resolution below 100 nm. The sensitivity of AFM-IR is improved to measure the chemical composition of nanostructures roughly 10 nm tall by applying wavelet transforms to the cantilever response. The IR identification of the smallest polymer nanostructures is about one order of magnitude improvement over state of the art. This improvement is enabled by our insights into the time-domain and frequency-domain behaviors of the polymer nanostructure and cantilever during AFM-IR. The capabilities of AFM-IR are further demonstrated by measuring ohmic heating in highly Si doped InAs microparticles caused by

  5. Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy.

    PubMed

    Somnath, Suhas; Collins, Liam; Matheson, Michael A; Sukumar, Sreenivas R; Kalinin, Sergei V; Jesse, Stephen

    2016-10-14

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip-sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques. PMID:27607339

  6. Negative differential conductance in InAs wire based double quantum dot induced by a charged AFM tip

    SciTech Connect

    Zhukov, A. A.; Volk, Ch.; Winden, A.; Hardtdegen, H.; Schaepers, Th.

    2012-12-15

    We investigate the conductance of an InAs nanowire in the nonlinear regime in the case of low electron density where the wire is split into quantum dots connected in series. The negative differential conductance in the wire is initiated by means of a charged atomic force microscope tip adjusting the transparency of the tunneling barrier between two adjoining quantum dots. We confirm that the negative differential conductance arises due to the resonant tunneling between these two adjoining quantum dots. The influence of the transparency of the blocking barriers and the relative position of energy states in the adjoining dots on a decrease of the negative differential conductance is investigated in detail.

  7. Lateral tip control effects in critical dimension atomic force microscope metrology: the large tip limit

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald G.; Orji, Ndubuisi G.; Goldband, Ryan S.

    2016-01-01

    Sidewall sensing in critical dimension atomic force microscopes (CD-AFMs) usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezoactuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. Understanding the influence and dependence of the effective tip width on the dither settings and lateral stiffness of the tip can improve the measurement accuracy and uncertainty estimation for CD-AFM measurements. Since CD-AFM typically uses tips that range from 15 to 850 nm in geometrical width, the behavior of effective tip width throughout this range should be understood. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. For tip widths of 130 nm and lower, which also have lower lateral stiffness, the response of the effective tip width to lateral dither is greater than for larger tips. However, we have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To confirm that our prior conclusions about the dependence of effective tip width on lateral stiffness are valid for large CD tips, we recently performed experiments using a very large non-CD tip with an etched plateau of ˜2-μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm/V is the baseline

  8. Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method

    NASA Astrophysics Data System (ADS)

    Li, Qi; Gao, Sitian; Li, Wei; Lu, Mingzhen; Shi, Yushu

    2013-05-01

    A large range multi-functional metrological atomic force microscope based on optical beam deflection method has been set up at NIM one year ago. Being designed intended to make a traceable measurement of standard samples, the machine uses three axes stacked piezoceramic actuators, each axis with a pair of push-pull piezo operated at opposite phases to make orthogonal scanning with maximized dimensional up to 50×50×2mm3. The stage displacement is measured by homodyne interferometer framework in x,y,z direction, from which beams are aligned to intersect at cantilever tip to avoid Abbe error, an eight times optical path multiplier interferometer mirror is researched to enhance fringe resolution. There is also a new compact AFM head integrated with LD, quadrant PD, cantilever, optical path and microscope, the head uses special track lens group to guarantee laser spot focused and static on the back of the cantilever, no matter whether or not the cantilever have lateral movements; similarly, reflect beam also focused and static in the center of quadrant detector through convergence lens group, assumed no cantilever bending on vertical direction. Attribute to above design, the AFM have a resolution up to 0.5nm. In the paper, further improvement is described to reduce the influence of parasitic interference caused by reflection from sample surface using laser multimode modulation, the results shows metrological AFM have a better performance in measuring step, lateral pitch, line width, nanoroughness and other nanoscale structures.

  9. Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (Invited Paper)

    NASA Astrophysics Data System (ADS)

    Nysten, Bernard; Fretigny, Christian; Cuenot, Stephane

    2005-05-01

    Resonant contact atomic force microscopy (resonant C-AFM) is used to quantitatively measure the elastic modulus of polymer nanotubes and metallic nanowires. To achieve this, an oscillating electric field is applied between the sample holder and the microscope head to excite the oscillation of the cantilever in contact with the nanostructures suspended over the pores of a membrane. The resonance frequency of the cantilever with the tip in contact with a nanostructure is shifted to higher values with respect to the resonance frequency of the free cantilever. It is demonstrated that the system can simply be modeled by a cantilever with the tip in contact with two springs. The measurement of the frequency shift enables the direct determination of the spring stiffness, i.e. the nanowires or nanotube stiffness. The method also enables the determination of the boundary conditions of the nanobeam on the membrane. The tensile elastic modulus is then simply determined using the classical theory of beam deflection. The obtained results for the larger nanostructures fairly agree to the values reported in the literature for the macroscopic elastic modulus of the corresponding materials. The measured modulus of the nanomaterials with smaller diameters is significantly higher than that of the larger ones. The increase of the apparent elastic modulus for the smaller diameters is attributed to the surface tension effects. It is thus demonstrated that resonant C-AFM enables the measurement of the elastic modulus and of the surface tension of nanomaterials.

  10. Resonant frequency and sensitivity of a caliper formed with assembled cantilever probes based on the modified strain gradient theory.

    PubMed

    Abbasi, Mohammad; Afkhami, Seyed E

    2014-12-01

    The resonant frequency and sensitivity of an atomic force microscope (AFM) with an assembled cantilever probe (ACP) is analyzed utilizing strain gradient theory, and then the governing equation and boundary conditions are derived by a combination of the basic equations of strain gradient theory and Hamilton's principle. The resonant frequency and sensitivity of the proposed AFM microcantilever are then obtained numerically. The proposed ACP includes a horizontal cantilever, two vertical extensions, and two tips located at the free ends of the extensions that form a caliper. As one of the extensions is located between the clamped and free ends of the AFM microcantilever, the cantilever is modeled as two beams. The results of the current model are compared with those evaluated by both modified couple stress and classical beam theories. The difference in results evaluated by the strain gradient theory and those predicted by the couple stress and classical beam theories is significant, especially when the microcantilever thickness is approximately the same as the material length-scale parameters. The results also indicate that at the low values of contact stiffness, scanning in the higher cantilever modes decrease the accuracy of the proposed AFM ACP. PMID:25205330

  11. Polymorphism of amyloid fibrils formed by a peptide from the yeast prion protein Sup35: AFM and Tip-Enhanced Raman Scattering studies.

    PubMed

    Krasnoslobodtsev, Alexey V; Deckert-Gaudig, Tanja; Zhang, Yuliang; Deckert, Volker; Lyubchenko, Yuri L

    2016-06-01

    Aggregation of prion proteins is the cause of various prion related diseases. The infectious form of prions, amyloid aggregates, exist as multiple strains. The strains are thought to represent structurally different prion protein molecules packed into amyloid aggregates, but the knowledge on the structure of different types of aggregates is limited. Here we report on the use of AFM (Atomic Force Microscopy) and TERS (Tip-Enhanced Raman Scattering) to study morphological heterogeneity and access underlying conformational features of individual amyloid aggregates. Using AFM we identified the morphology of amyloid fibrils formed by the peptide (CGNNQQNY) from the yeast prion protein Sup35 that is critically involved in the aggregation of the full protein. TERS results demonstrate that morphologically different amyloid fibrils are composed of a distinct set of conformations. Fibrils formed at pH 5.6 are composed of a mixture of peptide conformations (β-sheets, random coil and α-helix) while fibrils formed in pH~2 solution primarily have β-sheets. Additionally, peak positions in the amide III region of the TERS spectra suggested that peptides have parallel arrangement of β-sheets for pH~2 fibrils and antiparallel arrangement for fibrils formed at pH 5.6. We also developed a methodology for detailed analysis of the peptide secondary structure by correlating intensity changes of Raman bands in different regions of TERS spectra. Such correlation established that structural composition of peptides is highly localized with large contribution of unordered secondary structures on a fibrillar surface. PMID:27060278

  12. Label-Free Glucose Detection Using Cantilever Sensor Technology Based on Gravimetric Detection Principles

    PubMed Central

    Hsieh, Chiung-wen; Lin, Po-Chiao

    2013-01-01

    Efficient maintenance of glucose homeostasis is a major challenge in diabetes therapy, where accurate and reliable glucose level detection is required. Though several methods are currently used, these suffer from impaired response and often unpredictable drift, making them unsuitable for long-term therapeutic practice. In this study, we demonstrate a method that uses a functionalized atomic force microscope (AFM) cantilever as the sensor for reliable glucose detection with sufficient sensitivity and selectivity for clinical use. We first modified the AFM tip with aminopropylsilatrane (APS) and then adsorbed glucose-specific lectin concanavalin A (Con A) onto the surface. The Con A/APS-modified probes were then used to detect glucose by monitoring shifts in the cantilever resonance frequency. To confirm the molecule-specific interaction, AFM topographical images were acquired of identically treated silicon substrates which indicated a specific attachment for glucose-Con A and not for galactose-Con A. These results demonstrate that by monitoring the frequency shift of the AFM cantilever, this sensing system can detect the interaction between Con A and glucose, one of the biomolecule recognition processes, and may assist in the detection and mass quantification of glucose for clinical applications with very high sensitivity. PMID:23984191

  13. Prototype cantilevers for quantitative lateral force microscopy

    SciTech Connect

    Reitsma, Mark G.; Gates, Richard S.; Friedman, Lawrence H.; Cook, Robert F.

    2011-09-15

    Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

  14. Characterization of piesoelectric ZnO thin films and the fabrication of piezoelectric micro-cantilevers

    SciTech Connect

    Johnson, Raegan Lynn

    2005-08-01

    In Atomic Force Microscopy (AFM), a microcantilever is raster scanned across the surface of a sample in order to obtain a topographical image of the sample's surface. In a traditional, optical AFM, the sample rests on a bulk piezoelectric tube and a control loop is used to control the tip-sample separation by actuating the piezo-tube. This method has several disadvantages--the most noticeable one being that response time of the piezo-tube is rather long which leads to slow imaging speeds. One possible solution aimed at improving the speed of imaging is to incorporate a thin piezoelectric film on top of the cantilever beam. This design not only improves the speed of imaging because the piezoelectric film replaces the piezo-tube as an actuator, but the film can also act as a sensor. In addition, the piezoelectric film can excite the cantilever beam near its resonance frequency. This project aims to fabricate piezoelectric microcantilevers for use in the AFM. Prior to fabricating the cantilevers and also part of this project, a systematic study was performed to examine the effects of deposition conditions on the quality of piezoelectric ZnO thin films deposited by RF sputtering. These results will be presented. The deposition parameters that produced the highest quality ZnO film were used in the fabrication of the piezoelectric cantilevers. Unfortunately, the fabricated cantilevers warped due to the intrinsic stress of the ZnO film and were therefore not usable in the AFM. The complete fabrication process will be detailed, the results will be discussed and reasons for the warping will be examined.

  15. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    PubMed Central

    Wang, Andrew; Butte, Manish J.

    2014-01-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished. PMID:25161320

  16. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.

    PubMed

    Wang, Andrew; Butte, Manish J

    2014-08-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished. PMID:25161320

  17. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    SciTech Connect

    Wang, Andrew; Butte, Manish J.

    2014-08-04

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  18. Tip-based nanofabrication: an approach to true nanotechnology

    NASA Astrophysics Data System (ADS)

    Schofield, Adam R.; Bloschock, Kristen P.; Kenny, Thomas W.

    2010-03-01

    In order to unlock the true potential of nanotechnology, the development of controlled nanomanufacturing techniques for individual structures is critical. While the capability to grow, deposit, and manipulate nanostructures currently exists, the ability to reliably fabricate these devices with controlled differences in size, shape, and orientation at various substrate positions does not exist. To bridge this gap, the Defense Advanced Research Projects Agency (DARPA) launched the Tip-Based Nanofabrication (TBN) research program with the intent of achieving controlled nanomanufacturing of nanowires, nanotubes and quantum dots using functionalized AFM cantilevers and tips. This work describes the background, goals, and current approaches being explored during the multi-year TBN program.

  19. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

    PubMed Central

    Klocke, Michael

    2016-01-01

    Summary A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  20. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  1. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip.

    PubMed

    Felts, Jonathan R; Somnath, Suhas; Ewoldt, Randy H; King, William P

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s(-1) or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature. PMID:22551550

  2. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Felts, Jonathan R.; Somnath, Suhas; Ewoldt, Randy H.; King, William P.

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s-1 or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  3. Nanoscale rippling on polymer surfaces induced by AFM manipulation

    PubMed Central

    2015-01-01

    Summary Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored and studied. Due to the possibility of varying and controlling various parameters, this phenomenon has recently gained a great interest for some technological applications. The advent of AFM cantilevers with integrated heaters has promoted further advances in the field. An alternative method to heating up the tip is based on solvent-assisted viscoplastic deformations, where the ripples develop upon the application of a relatively low force to a solvent-rich film. An ensemble of AFM-based procedures can thus produce nanoripples on polymeric surfaces quickly, efficiently, and with an unprecedented order and control. However, even if nanorippling has been observed in various distinct modes and many theoretical models have been since proposed, a full understanding of this phenomenon is still far from being achieved. This review aims at summarizing the current state of the art in the perspective of achieving control over the rippling process on polymers at a nanoscale level. PMID:26733086

  4. Oxide nanocrystal based nanocomposites for fabricating photoplastic AFM probes.

    PubMed

    Ingrosso, Chiara; Martin-Olmos, Cristina; Llobera, Andreu; Innocenti, Claudia; Sangregorio, Claudio; Striccoli, Marinella; Agostiano, Angela; Voigt, Anja; Gruetzner, Gabi; Brugger, Jürgen; Perez-Murano, Francesc; Curri, Maria Lucia

    2011-11-01

    We report on the synthesis, characterization and application of a novel nanocomposite made of a negative tone epoxy based photoresist modified with organic-capped Fe(2)O(3) nanocrystals (NCs). The mechanical properties of the nanocomposite drastically improve upon incorporation of a suitable concentration of NCs in the polymer, without deteriorating its photolithography performance. High aspect ratio 3D microstructures made of the nanocomposite have been fabricated with a uniform surface morphology and with a resolution down to few micrometres. The embedded organic-capped Fe(2)O(3) NCs drastically increase the stiffness and hardness of the epoxy based photoresist matrix, making the final material extremely interesting for manufacturing miniaturized polymer based mechanical devices and systems. In particular, the nanocomposite has been used as structural material for fabricating photoplastic Atomic Force Microscopy (AFM) probes with integrated tips showing outstanding mechanical response and high resolution imaging performance. The fabricated probes consist of straight cantilevers with low stress-gradient and high quality factors, incorporating sharp polymeric tips. They present considerably improved performance compared to pure epoxy based photoresist AFM probes, and to commercial silicon AFM probes. PMID:21858377

  5. Qplus AFM driven nanostencil.

    PubMed

    Grévin, B; Fakir, M; Hayton, J; Brun, M; Demadrille, R; Faure-Vincent, J

    2011-06-01

    We describe the development of a novel setup, in which large stencils with suspended silicon nitride membranes are combined with atomic force microscopy (AFM) regulation by using tuning forks. This system offers the possibility to perform separate AFM and nanostencil operations, as well as combined modes when using stencil chips with integrated tips. The flexibility and performances are demonstrated through a series of examples, including wide AFM scans in closed loop mode, probe positioning repeatability of a few tens of nanometer, simultaneous evaporation of large (several hundred of micron square) and nanoscopic metals and fullerene patterns in static, multistep, and dynamic modes. This approach paves the way for further developments, as it fully combines the advantages of conventional stenciling with the ones of an AFM driven shadow mask. PMID:21721701

  6. Exploiting cantilever curvature for noise reduction in atomic force microscopy.

    PubMed

    Labuda, Aleksander; Grütter, Peter H

    2011-01-01

    Optical beam deflection is a widely used method for detecting the deflection of atomic force microscope (AFM) cantilevers. This paper presents a first order derivation for the angular detection noise density which determines the lower limit for deflection sensing. Surprisingly, the cantilever radius of curvature, commonly not considered, plays a crucial role and can be exploited to decrease angular detection noise. We demonstrate a reduction in angular detection shot noise of more than an order of magnitude on a home-built AFM with a commercial 450 μm long cantilever by exploiting the optical properties of the cantilever curvature caused by the reflective gold coating. Lastly, we demonstrate how cantilever curvature can be responsible for up to 45% of the variability in the measured sensitivity of cantilevers on commercially available AFMs. PMID:21280834

  7. Nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Ewoldt, Randy; Felts, Jonathan; Somnath, Suhas; King, William

    2012-11-01

    We experimentally investigate nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever, a nanofabrication process known as thermal dip-pen nanolithography (tDPN). Fluid is deposited from the AFM tip onto non-porous substrates whether the tip is moving or fixed. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. Additionally, the flow rate increases when a temperature gradient exists between the tip and substrate. We hypothesize that the polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  8. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  9. Afm Measrurements of Martian Soil Particles Using Mems Technology - Results from the PHOENIX Mission

    NASA Astrophysics Data System (ADS)

    Gautsch, S.; Parrat, D.; de Rooij, N. F.; Staufer, U.; Morookian, J. M.; Hecht, M. H.; Vijendran, S.; Sykulska, H.; Pike, W. T.

    2011-12-01

    Light scattering experiments conducted on Mars indicated that soil particles have dimensions around 1 μm. Particles in that range play an important role in the gas exchange between sub-surface water ice and the atmosphere. Their shape can help tracing the geological history and may indicate past presence of liquid water. NASA's Phoenix mission therefore decided to analyze soil and dust particles in the sub-micrometer to a few micrometer range using an atomic force microscope (AFM) for the first time on another planet. The co-axially mounted AFM was capable of resolving particles with 10nm lateral resolution. A MEMS approach combined with mechatronic concepts for the scanner was selected for implementing the AFM. For redundancy, the sensor chip featured eight silicon cantilevers each with a 7 to 8 μm high tip. The cantilevers could be cleaved off if contaminated. During NASA's Phoenix Mission, which operated on the red planet from May to October 2008, we could demonstrate successful AFM operations. The instrument has executed 85 experiments of which 26 were needed for calibration. Of the remaining experiments about half (28) returned images where signatures of particles could be discerned.

  10. Vertically aligned nanostructure scanning probe microscope tips

    SciTech Connect

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  11. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    PubMed

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position. PMID:26324257

  12. Serial weighting of micro-objects with resonant microchanneled cantilevers.

    PubMed

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-14

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples. PMID:27608651

  13. Demonstration of an electrostatic-shielded cantilever

    SciTech Connect

    Pingue, P.; Piazza, V.; Baschieri, P.; Ascoli, C.; Menozzi, C.; Alessandrini, A.; Facci, P.

    2006-01-23

    The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si{sub 3}N{sub 4} cantilever chip is presented. Nanomachining and metal deposition induced by focused ion beam techniques were employed in order to modify the original insulating pyramidal tip and insert a conducting metallic tip. Two parallel metallic electrodes deposited on the original cantilever arms are employed for tip biasing and as ground plane in order to minimize the electrostatic force due to the capacitive interaction between cantilever and sample surface. Excitation spectra and force-to-distance characterization are shown with different electrode configurations. Applications of this scheme in electrostatic force microscopy, Kelvin probe microscopy and local anodic oxidation is discussed.

  14. Charge Content In Nanometer Rings from Atomic Force Microscope (AFM) Traces

    NASA Astrophysics Data System (ADS)

    Zypman, F.; Eppell, S.; Feinstein, M.; Fried, Y.; Lazarev, D.; Metzger, C.

    The last few years have seen a growing interest in identifying charge content in small structures such as graphene ribbons and aromatic biorings. More generally it is believed that charge content in proteins holds the key to the ultimate understanding of biological self-assembly. Here we describe a model system, a charged ring inside liquid probed by an AFM tip, and show how the charge content and the relative size of the ring with respect to the tip affect the measured force. More importantly, we explain how to measure the charge from the AFM experimental data. The process involves the modeling of the dynamics of the tip-cantilever sensor under the influence of the charged sample, but also of ambient hydrodynamic forces, electrostatic interactions that appear due to charge induction in the tip and electrolytic screening. Of particular relevance is the possibility of our approach to treat analytically the size of ions. This is relevant when the tip-sample distance becomes sub-nanometric, and the more common description via Poisson-Boltzmann equation breaks down. Funding for this research ``Instrument Development: Charge Sensing In Fluids With Nanometer Precision'' is provided by Chemical Measurement & Imaging, National Science Foundation, Grant Number 1508085.

  15. Compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry Joseph

    2006-08-15

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  16. Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation

    NASA Astrophysics Data System (ADS)

    Weafer, P. P.; McGarry, J. P.; van Es, M. H.; Kilpatrick, J. I.; Ronan, W.; Nolan, D. R.; Jarvis, S. P.

    2012-09-01

    Atomic force microscopy (AFM) is widely used in the study of both morphology and mechanical properties of living cells under physiologically relevant conditions. However, quantitative experiments on timescales of minutes to hours are generally limited by thermal drift in the instrument, particularly in the vertical (z) direction. In addition, we demonstrate the necessity to remove all air-liquid interfaces within the system for measurements in liquid environments, which may otherwise result in perturbations in the measured deflection. These effects severely limit the use of AFM as a practical tool for the study of long-term cell behavior, where precise knowledge of the tip-sample distance is a crucial requirement. Here we present a readily implementable, cost effective method of minimizing z-drift and liquid instabilities by utilizing active temperature control combined with a customized fluid cell system. Long-term whole cell mechanical measurements were performed using this stabilized AFM by attaching a large sphere to a cantilever in order to approximate a parallel plate system. An extensive examination of the effects of sphere attachment on AFM data is presented. Profiling of cantilever bending during substrate indentation revealed that the optical lever assumption of free ended cantilevering is inappropriate when sphere constraining occurs, which applies an additional torque to the cantilevers "free" end. Here we present the steps required to accurately determine force-indentation measurements for such a scenario. Combining these readily implementable modifications, we demonstrate the ability to investigate long-term whole cell mechanics by performing strain controlled cyclic deformation of single osteoblasts.

  17. MOS-based nanocapacitor using C-AFM

    NASA Astrophysics Data System (ADS)

    Hill, Daniel; Sadewasser, Sascha; Aymerich, Xavier

    2003-04-01

    This report details the attempts made to realise nanocapacitors for nanoscale MOS based integrated circuits by AFM anodic oxidation, and therefore isolation, of nano-sized squares of poly-silicon, titanium and aluminium on Si/SiO2. Conductive AFM (C-AFM) was used to perform topographical and electrical characterisation. The experiments were performed with contact mode C-AFM, in ambient air, using Pt-Ir, Co-Cr and Ti coated (20nm) n-type silicon cantilevers. Each sample consisted of a 3-5nm thick conductor deposited on 6nm of SiO2, which was thermally grown on Phosphorus doped (1019 cm-3) n-type Si(100) substrates. Standard cleaning and passivation processes were used. Poly-silicon was immediately found to be too rough to oxidise. Initial current-voltage measurements inside of the titanium-oxide squares suggest initial isolation followed by degradation through Fowler-Nordheim tunnelling. Measurement inconsistencies seen suggest charge storage on the surface or tip with the barrier height of the native titanium oxide thought to be responsible. Al has a thicker natural oxide. To overcome this we designed a series of structures consisting of a Ti finger on SiO2, that is connected to a Ti bond pad, allowing direct probing by a semiconductor parameter analyser. AFM anodic oxidation was performed upon these Ti fingers to reduce their in-plane dimensions towards the nanoscale. To confirm the existence of a nanocapacitor topographical and electrical measurements were then done on and around them.

  18. ezAFM: A low cost Atomic Force Microscope(AFM)

    NASA Astrophysics Data System (ADS)

    Celik, Umit; Celik, Kubra; Aslan, Husnu; Kehribar, Ihsan; Dede, Munir; Ozgur Ozer, H.; Oral, Ahmet

    2012-02-01

    A low cost AFM, ezAFM is developed for educational purposes as well as research. Optical beam deflection method is used to measure the deflection of cantilever. ezAFM scanner is built using voice coil motors (VCM) with ˜50x50x6 μm scan area. The microscope uses alignment free cantilevers, which minimizes setup times. FPGA based AFM feedback Control electronics is developed. FPGA technology allows us to drive all peripherals in parallel. ezAFM Controller is connected to PC by USB 2.0 interface as well as Wi-Fi. We have achieved <5nm lateral and ˜0.01nm vertical resolution. ezAFM can image single atomic steps in HOPG and mica. An optical microscope with <3 μm resolution is also integrated into the system. ezAFM supports different AFM operation modes such as dynamic mode, contact mode, lateral force microscopy. Advanced modes like magnetic force microscopy and electric force microscopy will be implemented later on. The new ezAFM system provides, short learning times for student labs, quick setup and easy to transport for portable applications with the best price/performance ratio. The cost of the system starts from 15,000, with system performance comparable with the traditional AFM systems.

  19. A Multifunctional Frontloading Approach for Repeated Recycling of a Pressure-Controlled AFM Micropipette.

    PubMed

    Roder, Phillip; Hille, Carsten

    2015-01-01

    Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressure-controlled microscale liquid dispenser. This frontloading procedure seems especially attractive when using target substances featuring high costs or low available amounts. Here, the AFM micropipette could be filled from the tip side with liquid from a previously applied droplet with a volume of only a few μL using a short low-pressure pulse. The liquid-loaded AFM micropipettes could be then applied for experiments in air or liquid environments. AFM micropipette frontloading was evaluated with the well-known organic fluorescent dye rhodamine 6G and the AlexaFluor647-labeled antibody goat anti-rat IgG as an example of a larger biological compound. After micropipette usage, specific cleaning procedures were tested. Furthermore, a storage method is described, at which the AFM micropipettes could be stored for a few hours up to several days without drying out or clogging of the microchannel. In summary, the rapid, versatile and cost-efficient frontloading and cleaning procedure for the repeated usage of a single AFM micropipette is beneficial for various application situations from specific surface modifications through to local manipulation of living cells, and provides a simplified and faster handling for already known experiments with fluid force microscopy. PMID:26636981

  20. A Multifunctional Frontloading Approach for Repeated Recycling of a Pressure-Controlled AFM Micropipette

    PubMed Central

    Roder, Phillip; Hille, Carsten

    2015-01-01

    Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressure-controlled microscale liquid dispenser. This frontloading procedure seems especially attractive when using target substances featuring high costs or low available amounts. Here, the AFM micropipette could be filled from the tip side with liquid from a previously applied droplet with a volume of only a few μL using a short low-pressure pulse. The liquid-loaded AFM micropipettes could be then applied for experiments in air or liquid environments. AFM micropipette frontloading was evaluated with the well-known organic fluorescent dye rhodamine 6G and the AlexaFluor647-labeled antibody goat anti-rat IgG as an example of a larger biological compound. After micropipette usage, specific cleaning procedures were tested. Furthermore, a storage method is described, at which the AFM micropipettes could be stored for a few hours up to several days without drying out or clogging of the microchannel. In summary, the rapid, versatile and cost-efficient frontloading and cleaning procedure for the repeated usage of a single AFM micropipette is beneficial for various application situations from specific surface modifications through to local manipulation of living cells, and provides a simplified and faster handling for already known experiments with fluid force microscopy. PMID:26636981

  1. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid

    NASA Astrophysics Data System (ADS)

    Reza Akrami, Seyed Mohammad; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-01

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ˜10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  2. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid

    SciTech Connect

    Reza Akrami, Seyed Mohammad; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-15

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  3. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Shegaonkar, Ajit C.; Salapaka, Srinivasa M.

    2007-10-01

    This paper presents a feedback scheme that simultaneously corrects, in real time, for the imaging artifacts caused by cantilever and photosensor misalignments as well as misinterpretations in relative lateral position of the tip with respect to the sample due to the tip-sample stick in atomic force microscopy (AFM). The optical beam bounce method, typically used in AFM for imaging, is sensitive to inaccuracies of cantilever geometry and the relative misalignment of the laser source, cantilever, and the laser sensitive diode from the intended design. These inaccuracies, which contribute to the geometrical cross-talk between the normal and the lateral signals, become prominent at the atomic and subnanometer scales, and thereby impede high resolution imaging studies. The feedback scheme accounts for these artifacts and makes imaging insensitive to, in fact, practically independent of these inaccuracies. This scheme counteracts the lateral twisting dynamics of the cantilever, and as a result, it avoids the misinterpretation problem of the relative lateral position of the cantilever tip from the sample and thereby avoids the corresponding imaging artifacts that are typically prominent in contact mode friction force microscopy (FFM). The feedback scheme consists of simultaneously regulating the normal as well as the lateral cantilever deflection signal at their respective set points. This not only removes the imaging artifacts due to geometrical misalignments, mechanical cross-talk, and irregular sliding but also the corresponding compensatory control signal gives a more accurate real time measure of the lateral interaction force between the sample and the cantilever as compared to the lateral deflection signal used in FFM. Experimental results show significant improvement, and in some cases, practical elimination of the artifacts. The design and implementation of a split piezoassembly needed for the lateral actuation for the feedback scheme are also presented.

  4. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.

    PubMed

    Shegaonkar, Ajit C; Salapaka, Srinivasa M

    2007-10-01

    This paper presents a feedback scheme that simultaneously corrects, in real time, for the imaging artifacts caused by cantilever and photosensor misalignments as well as misinterpretations in relative lateral position of the tip with respect to the sample due to the tip-sample stick in atomic force microscopy (AFM). The optical beam bounce method, typically used in AFM for imaging, is sensitive to inaccuracies of cantilever geometry and the relative misalignment of the laser source, cantilever, and the laser sensitive diode from the intended design. These inaccuracies, which contribute to the geometrical cross-talk between the normal and the lateral signals, become prominent at the atomic and subnanometer scales, and thereby impede high resolution imaging studies. The feedback scheme accounts for these artifacts and makes imaging insensitive to, in fact, practically independent of these inaccuracies. This scheme counteracts the lateral twisting dynamics of the cantilever, and as a result, it avoids the misinterpretation problem of the relative lateral position of the cantilever tip from the sample and thereby avoids the corresponding imaging artifacts that are typically prominent in contact mode friction force microscopy (FFM). The feedback scheme consists of simultaneously regulating the normal as well as the lateral cantilever deflection signal at their respective set points. This not only removes the imaging artifacts due to geometrical misalignments, mechanical cross-talk, and irregular sliding but also the corresponding compensatory control signal gives a more accurate real time measure of the lateral interaction force between the sample and the cantilever as compared to the lateral deflection signal used in FFM. Experimental results show significant improvement, and in some cases, practical elimination of the artifacts. The design and implementation of a split piezoassembly needed for the lateral actuation for the feedback scheme are also presented. PMID

  5. Microrheology using a custom-made AFM

    NASA Astrophysics Data System (ADS)

    Kosgodagan Acharige, Sebastien; Benzaquen, Michael; Steinberger, Audrey

    In the past few years, a new method was developed to measure local properties of liquids (X. Xiong et al., Phys. Rev. E 80, 2009). This method consists of gluing a micron-sized glass fiber at the tip of an AFM cantilever and probing the liquid with it. In ENS Lyon, this method was perfected (C. Devailly et al., EPL, 106 5, 2014) with the help of an interferometer developped in the same laboratory (L. Bellon et al., Opt. Commun. 207 49, 2002 and P. Paolino et al., Rev. Sci. Instrum. 84, 2013), which background noise can reach 10-14 m /√{ Hz } . This method allows us to measure a wide range of viscosities (1 mPa . s to 500 mPa . s) of transparent and opaque fluids using a small sample volume ( 5 mL). In this presentation, I will briefly describe the interferometer developped in ENS Lyon, then explain precisely the microrheology measurements and then compare the experimental results to a model developped by M. Benzaquen. This work is supported financially by the ANR project NANOFLUIDYN (Grant Number ANR-13-BS10-0009).

  6. A Batch Fabricated SECM-AFM Probe

    NASA Astrophysics Data System (ADS)

    Dobson, P. S.; Macpherson, J. V.; Holder, M.; Weaver, J. M. R.

    2003-12-01

    A scheme for the fabrication of combined Scanning Electrochemical Microscopy — Atomic Force Microscopy (SECM-AFM) probes is presented for both silicon nitride and silicon cantilevers. The advantages over exsisting methods used for their production is explained. The process flow is described and initial results from electrodeposition of silver are presented.

  7. Liquid contact resonance AFM: analytical models, experiments, and limitations

    NASA Astrophysics Data System (ADS)

    Parlak, Zehra; Tu, Qing; Zauscher, Stefan

    2014-11-01

    Contact resonance AFM (CR-AFM) is a scanning probe microscopy technique that utilizes the contact resonances of the AFM cantilever for concurrent imaging of topography and surface stiffness. The technique has not been used in liquid until recently due to analytical and experimental difficulties, associated with viscous damping of cantilever vibrations and fluid loading effects. To address these difficulties, (i) an analytical approach for contact resonances in liquid is developed, and (ii) direct excitation of the contact resonances is demonstrated by actuating the cantilever directly in a magnetic field. By implementing the analytical approach and the direct actuation through magnetic particles, quantitative stiffness imaging on surfaces with a wide range of stiffness can be achieved in liquid with soft cantilevers and low contact forces.

  8. Characterization of the cutting edge of glass knives for ultramicrotomy by scanning force microscopy using cantilevers with a defined tip geometry

    PubMed

    Matzelle; Kruse; Reichelt

    2000-09-01

    The geometry of glass knife edges for ultramicrotomy was studied with nanoscale resolution using scanning force microscopy (SFM) in the contact mode. The local shape of the cutting edge was estimated from single line profiles of the SFM topographic images by taking into account the exact radius of the ultrasharp silicon tip. The tip radius was estimated from secondary electron micrographs recorded at low voltage by field emission scanning electron microscopy (FESEM). The radius of the investigated cutting edges was found to be in range 5-20 nm. The results obtained illustrate that the combination of SFM and high resolution FESEM provides a unique means to determine precisely the radius of glass knives. PMID:10971804

  9. AFM Studies of Conformational Changes in Proteins and Peptides

    NASA Astrophysics Data System (ADS)

    Ploscariu, Nicoleta; Sukthankar, Pinakin; Tomich, John; Szoszkiewicz, Robert

    2015-03-01

    Here, we present estimates of molecular stiffness and mechanical energy dissipation factors for some examples of proteins and peptides. The results are obtained from AFM force spectroscopy measurements. To determine molecular stiffness and mechanical energy dissipation factors we developed a model based on measuring several resonance frequencies of an AFM cantilever in contact with either single protein molecule or peptides adsorbed on arbitrary surface. We used compliant AFM cantilevers with a small aspect ratio - a ratio of length to width - in air and in liquid, including biologically relevant phosphate buffered saline medium. Department of Physics.

  10. Self-sensing piezoresistive cantilever and its magnetic force microscopy applications.

    PubMed

    Takahashi, Hiroshi; Ando, Kazunori; Shirakawabe, Yoshiharu

    2002-05-01

    A newly developed Si self-sensing piezoresistive cantilever is presented. Si piezoresistive cantilevers for scanning microscopy are fabricated by Si micro-machining technique. The sensitivity of the piezoresistive cantilever is comparable to the current laser detecting system. Topographic images are successfully obtained with the piezoresistive cantilever and some comparisons are made with the laser detecting system. Furthermore, the magnetic film (Co-Cr-Pt) is coated on the tip of the piezoresistive cantilever for magnetic force microscopy (MFM) application. The magnetic images are successfully obtained with the self-sensing MFM piezoresistive cantilever. The self-sensing piezoresistive cantilevers have been successfully applied in scanning probe microscopy and MFM. PMID:12211485

  11. Single ricin detection by AFM chemomechanical mapping

    Technology Transfer Automated Retrieval System (TEKTRAN)

    This research reports a method of detecting ricin molecules immobilized on chemically modified gold (Au;111) surface by chemomechanically mapping the molecular interactions with a chemically modified Atomic Force Microscope (AFM) tip. AFM images resolved the different fold-up conformations of single...

  12. Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments.

    PubMed

    Guzman, Horacio V; Garcia, Pablo D; Garcia, Ricardo

    2015-01-01

    We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever-tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the instantaneous deflection and tip-surface force, velocity, virial, dissipated energy, sample deformation and peak force as a function of time or distance. The simulator includes a variety of interactions and contact mechanics models to describe AFM experiments including: van der Waals, Hertz, DMT, JKR, bottom effect cone correction, linear viscoelastic forces or the standard linear solid viscoelastic model. We have compared two numerical integration methods to select the one that offers optimal accuracy and speed. The graphical user interface has been designed to facilitate the navigation of non-experts in simulations. Finally, the accuracy of dForce has been tested against numerical simulations performed during the last 18 years. PMID:25821676

  13. High-Resolution Imaging of Plasmid DNA in Liquids in Dynamic Mode Atomic Force Microscopy Using a Carbon Nanofiber Tip

    NASA Astrophysics Data System (ADS)

    Kitazawa, Masashi; Ito, Shuichi; Yagi, Akira; Sakai, Nobuaki; Uekusa, Yoshitugu; Ohta, Ryo; Inaba, Kazuhisa; Hayashi, Akari; Hayashi, Yasuhiko; Tanemura, Masaki

    2011-08-01

    To understand the motion of DNA and DNA complexes, the real-time visualization of living DNA in liquids is quite important. Here, we report the high-resolution imaging of plasmid DNA in water using a rapid-scan atomic force microscopy (AFM) system equipped with a carbon nanofiber (CNF) probe. To achieve a rapid high-resolution scan, small SiN cantilevers with dimensions of 2 (width) × 0.1 (thickness) × 9 µm (length) and a bent end (tip view structure) were employed as base cantilevers onto which single CNFs were grown. The resonant frequencies of the cantilever were 1.5 MHz in air and 500 kHz in water, and the spring constant was calculated to be 0.1 N/m. Single CNFs, typically 88 nm in length, were formed on an array of the cantilevers in a batch process by the ion-irradiation method. An AFM image of a plasmid DNA taken in water at 0.2 fps (5 s/image) using a batch-fabricated CNF-tipped cantilever clearly showed the helix turns of the double strand DNA. The average helical pitch measured 3.4 nm (σ: 0.5 nm), which was in good agreement with that determined by the X-ray diffraction method, 3.4 nm. Thus, it is presumed that the combined use of the rapid-scan AFM system with the ion-induced CNF probe is promising for the dynamic analysis of biomolecules.

  14. Dual AFM probes alignment based on vision guidance

    NASA Astrophysics Data System (ADS)

    Zhang, Hua-kun; Gao, Si-tian; Lu, Ming-zhen; Wang, Long-long

    2013-10-01

    Atomic force microscope (AFM) with dual probes that operate together can measure both side walls excellently at the same time, which virtually eliminates the prevalent effect of probe width that contributes a large component of uncertainty in measurement results and finally obtains the critical dimension (CD)(e.g. the linewidth) through data synthesis. In calibration process, the dual probes must contact each other in advance, which realizes the alignment in the three dimensions, to establish a zero reference point and ensure the accuracy of measurement. Because nowadays the optical resolution of advanced lens have exceeded micrometer range, and the size of probes is within micro level, it is possible to acquire dual probes images in both horizontal and vertical directions, through which the movement of the probes can be controlled in time. In order to further enhance the alignment precision, sub-pixel edge detection method based on Zernike orthogonal moment is used to obtain relative position between these two probes, which helps the tips alignment attains sub-micron range. Piezoelectric nanopositioning stages calibrated by laser interferometer are used to implement fine movement of the probes to verify the accuracy of the experimental results. To simplify the system, novel self-sensing and self-actuating probe based on a quartz tuning fork combined with a micromachined cantilever is used for dynamic mode AFM. In this case, an external optical detection system is not needed, so the system is simple and small.

  15. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    NASA Astrophysics Data System (ADS)

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-01

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5-10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100-500 Hz for scan areas of several micrometers in size.

  16. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    SciTech Connect

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  17. Periodic Charging of Individual Molecules Coupled to the Motion of an Atomic Force Microscopy Tip.

    PubMed

    Kocić, N; Weiderer, P; Keller, S; Decurtins, S; Liu, S-X; Repp, J

    2015-07-01

    Individual molecules at the edges of self-assembled islands grown on Ag(111) can be deliberately switched in their charge state with the electric field from a scanning-probe tip. Close to the threshold voltage for a charge state transition, periodic switching of the charge is directly driven by the cantilever motion in frequency-modulated atomic force microscopy (AFM), as can be deduced from the signature in the measured frequency shift. In this regime, the integrated frequency shift yields the tip-sample force that is due to a single additional electron. Further, the signature of the dynamic charging response provides information on the electronic coupling of the molecule to the substrate. In analogy to previous experiments on quantum dots, this may also be used in the future to access excited state properties of single molecules from AFM experiments. PMID:26039575

  18. Understanding interferometry for micro-cantilever displacement detection

    PubMed Central

    Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Summary Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber–cantilever configurations. In the Fabry–Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. PMID:27547601

  19. Understanding interferometry for micro-cantilever displacement detection.

    PubMed

    von Schmidsfeld, Alexander; Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions. PMID:27547601

  20. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.

    PubMed

    Lin, Shueei Muh

    2007-01-01

    In a common environment of atomic force microscopy (AFM), a damping force occurs between a tip and a sample. The influence of damping on the dynamic response of a cantilever must be significant. Moreover, accurate theory is very helpful for the interpretation of a sample's topography and properties. In this study, the effects of damping and nonlinear interatomic tip-sample forces on the dynamic response of an amplitude-formulation AFM are investigated. The damping force is simulated by using the conventional Kelvin-Voigt damping model. The interatomic tip-sample force is the attractive van der Waals force. For consistance with real measurement of a cantilever, the mathematical equations of the beam theory of an AM-AFM are built and its analytical solution is derived. Moreover, an AFM system is also simplified into a mass-spring-damper model. Its exact solution is simple and intuitive. Several relations among the damping ratio, the response ratio, the frequency shift, the energy dissipation and the Q-factor are revealed. It is found that the resonant frequencies and the phase angles determined by the two models are almost same. Significant differences in the resonant quality factors and the response ratios determined by using the two models are also found. Finally, the influences of the variations of several parameters on the error of measuring a sample's topography are investigated. PMID:16982149

  1. Bi-stability of amplitude modulation AFM in air: deterministic and stochastic outcomes for imaging biomolecular systems.

    PubMed

    Santos, Sergio; Barcons, Victor; Font, Josep; Thomson, Neil H

    2010-06-01

    The dynamics of the oscillating microcantilever for amplitude modulation atomic force microscopy (AM AFM) operating in air is well understood theoretically but the experimental outcomes are still emerging. We use double-stranded DNA on mica as a model biomolecular system for investigating the connection between theory and experiment. A demonstration that the switching between the two cantilever oscillation states is stochastic in nature is achieved, and it can be induced by means of topographical anomalies on the surface. Whether one or the other attractor basin is accessed depends on the tip-sample separation history used to achieve the imaging conditions, and we show that the behaviour is reproducible when the tip is stable and well characterized. Emergence of background noise occurs in certain regions of parameter space regardless of whether two cantilever oscillation states coexist. The low state has been explored in detail and we note that at low to intermediate values of the free amplitude, noise-free imaging is achieved. The outcomes shown here are general and demonstrate that a thorough and systematic experimental approach in conjunction with standard modelling gives insight into the mechanisms behind image contrast formation in AM AFM in air. PMID:20453275

  2. Advanced tip design for liquid phase vibration mode atomic force microscopy.

    PubMed

    Muramatsu, Hiroshi; Yamamoto, Yuji; Shigeno, Masatsugu; Shirakawabe, Yoshiharu; Inoue, Akira; Kim, Woo-Sik; Kim, Seung Jin; Chang, Sang-Mok; Kim, Jong Min

    2008-03-24

    We have fabricated polymer tips for atomic force microscopy in order to elucidate the effects of tip length and shape on cantilever vibration damping in liquids. The vibration damping is investigated by measuring the vibration amplitude of cantilevers as a function of tip-sample distance. The cantilever with a short tip provides a higher damping effect over long tip-sample distances. When the vibration amplitude was rescaled to show the effect of the cantilever width on oscillation damping, the vibration amplitude of cantilevers with various tip lengths was similarly obtained in a long distance range over 50 microm. This similarity is explained by an acoustic damping model in which an acoustic wave is generated by the cantilever. Finally, the results indicate a cantilever with a sufficiently long tip compared to the cantilever width can dramatically reduce the long-range damping effect in a liquid environment. PMID:18328326

  3. Lattice-resolution imaging of the sapphire (0 0 0 1) surface in air by AFM

    NASA Astrophysics Data System (ADS)

    Gan, Yang; Wanless, Erica J.; Franks, George V.

    2007-02-01

    Lattice-resolution images of single-crystal α-alumina (sapphire) (0 0 0 1) surfaces have been obtained using contact-mode AFM under ambient conditions. It was found that the hexagonal surface lattice has a periodicity of 0.47 ± 0.11 nm, which is identical to that reported previously when the same surface was imaged in water. Large lattice corrugations (as high as 1 nm) were observed, but were concluded to be imaging artifacts because of the strong friction which causes additional deflection of the cantilever. The additional deflection of the cantilever is registered by the detector of the optical beam-deflection AFM resulting in an overestimation of the height at each lattice point. Abrupt changes were also resolved in the topography including honeycomb patterns and a transition from 2D lattices to 1D parallel stripes, with scanning direction. These phenomena can be explained by the commensurate sliding between the tip and sapphire surface due to the strong contact force.

  4. Characterization of the cutting edge of glass and diamond knives for ultramicrotomy by scanning force microscopy using cantilevers with a defined tip geometry. Part II.

    PubMed

    Matzelle, T R; Gnaegi, H; Ricker, A; Reichelt, R

    2003-02-01

    The cutting edge of glass as well as diamond knives was studied at high resolution using a scanning force microscope (SFM). The local shape of the cutting edge was estimated from single line profiles of the SFM topographs taking into account the exact shape of the probing tip estimated by a high-resolution field emission scanning electron microscope (FESEM). The glass knives were prepared by 'balanced breaking'. The radius of the investigated cutting edges was found to be 3.2-4.4 nm and 4.3-6.0 nm for the 35 degrees and 45 degrees diamond knife, respectively, and 3.4-4.3 nm for the glass knives. Besides the opening angle and the cutting edge radius, the friction of a knife during sectioning represents a significant factor influencing the quality of sections. Thus, the roughness of both the diamond clearance angle side and the back side was characterized as well. Corresponding RMS values of the roughness were found to be smaller on the back side (approximately 0.14 nm) than on the clearance angle side (approximately 0.26 nm). PMID:12588528

  5. Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

    SciTech Connect

    Wagner, Ryan; Raman, Arvind; Proksch, Roger

    2013-12-23

    Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

  6. Tip-based nanofabrication: an approach to true nanotechnology

    NASA Astrophysics Data System (ADS)

    Bloschock, Kristen P.; Schofield, Adam R.; Kenny, Thomas W.

    2011-06-01

    True nanotechnology, defined as the ability to reliably and repeatably fabricate nanostructures with controlled differences in size, shape, and orientation at precise substrate locations, currently does not exist. There are many examples demonstrating the capability to grow, deposit, and manipulate nanometer-sized features, but typically these techniques do not allow for controllable manufacturing of individual structures. To bridge this gap and to unlock the true potential of nanotechnology for defense sensing applications, the Defense Advanced Research Projects Agency (DARPA) launched the Tip-Based Nanofabrication (TBN) research program with the intent of achieving controlled manufacturing of nanostructures using functionalized AFM cantilevers and tips. This work describes the background, goals, and recent advances achieved during the multi-year TBN program.

  7. Optical actuation of silicon cantilevers: modelling and experimental investigation

    NASA Astrophysics Data System (ADS)

    Jiang, Fei; Keating, Adrian; Martyuink, Mariusz; Silva, Dilusha; Faraone, Lorenzo; Dell, John M.

    2013-05-01

    This paper reports on the modeling and experimental investigation of optical excitation of silicon cantilevers. In this work, the silicon cantilevers fabricated have dimensions with width of 15 μm, thickness of 0.26 μm, and variable length from 50 to 120 μm. In order to investigate the effect of the laser modulation frequency and position on the temperature at the anchor edge and displacements at the tip of cantilevers, a transient thermal ANSYS simulation and a steady-state static thermal mechanical ANSYS simulation were undertaken using a structure consisting of silicon device layer, SiO2 sacrificial layer and silicon substrate. The dynamic properties of silicon cantilevers were undertaken by a series of experiments. The period optical driving signal with controlled modulation amplitude was provided by a 405 nm diode laser with a 2.9 μW/μm2 laser power and variable frequencies. The laser spot was located through the longitude direction of silicon cantilevers. In factor, simulation results well matched with experimental observation, including: 1) for untreated silicon cantilevers, the maximum of displacement is observed when the laser beam was located half a diameter way from the anchor on the silicon suspended cantilever side; 2) for the both cantilevers, maximum displacement occurs when the optical actuation frequency is equal to the resonant frequency of cantilevers. Understanding the optical excitation on silicon cantilevers, as waveguides, can potentially increase sensing detection sensitivity (ratio of transmission to cantilever deflection).

  8. Topography imaging with a heated atomic force microscope cantilever in tapping mode

    SciTech Connect

    Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P.

    2007-04-15

    This article describes tapping mode atomic force microscopy (AFM) using a heated AFM cantilever. The electrical and thermal responses of the cantilever were investigated while the cantilever oscillated in free space or was in intermittent contact with a surface. The cantilever oscillates at its mechanical resonant frequency, 70.36 kHz, which is much faster than its thermal time constant of 300 {mu}s, and so the cantilever operates in thermal steady state. The thermal impedance between the cantilever heater and the sample was measured through the cantilever temperature signal. Topographical imaging was performed on silicon calibration gratings of height 20 and 100 nm. The obtained topography sensitivity is as high as 200 {mu}V/nm and the resolution is as good as 0.5 nm/Hz{sup 1/2}, depending on the cantilever power. The cantilever heating power ranges 0-7 mW, which corresponds to a temperature range of 25-700 deg. C. The imaging was performed entirely using the cantilever thermal signal and no laser or other optics was required. As in conventional AFM, the tapping mode operation demonstrated here can suppress imaging artifacts and enable imaging of soft samples.

  9. The Emergence of AFM Applications to Cell Biology: How new technologies are facilitating investigation of human cells in health and disease at the nanoscale

    PubMed Central

    Yang, Ruiguo; Xi, Ning; Fung, Carmen Kar Man; Seiffert-Sinha, Kristina; Lai, King Wai Chiu; Sinha, Animesh A.

    2013-01-01

    Atomic Force Microscopy (AFM) based nanorobotics has been used for building nano devices in semiconductors for almost a decade. Leveraging the unparallel precision localization capabilities of this technology, high resolution imaging and mechanical property characterization is now increasingly being performed in biological settings. AFM also offers the prospect for handling and manipulating biological materials at nanometer scale. It has unique advantages over other methods, permitting experiments in the liquid phase where physiological conditions can be maintained. Taking advantage of these properties, our group has visualized membrane and cytoskeletal structures of live cells by controlling the interaction force of the AFM tip with cellular components at the nN or sub-nN range. Cell stiffness changes were observed by statistically analyzing the Young’s modulus values of human keratinocytes before and after specific antibody treatment. Furthermore, we used the AFM cantilever as a robotic arm for mechanical pushing, pulling and cutting to perform nanoscale manipulations of cell-associated structures. AFM guided nano-dissection, or nanosurgery was enacted on the cell in order to sever intermediate filaments connecting neighboring keratinocytes via sub 100 nm resolution cuts. Finally, we have used a functionalized AFM tip to probe cell surface receptors to obtain binding force measurements. This technique formed the basis for Single Molecule Force Spectroscopy (SMFS). In addition to enhancing our basic understanding of dynamic signaling events in cell biology, these advancements in AFM based biomedical investigations can be expected to facilitate the search for biomarkers related to disease diagnosis progress and treatment. PMID:24416719

  10. On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids

    SciTech Connect

    Kiracofe, Daniel; Raman, Arvind

    2010-02-15

    The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated by measuring the vibrations of such microcantilevers in air and water using a scanning laser Doppler vibrometer. It is found that for rectangular tipless microcantilevers, the measured fundamental and higher eigenmodes and their equivalent stiffnesses are nearly identical in air and in water. However, for microcantilevers with a tip mass or for picket shaped cantilevers, there is a marked difference in the second (and higher) eigenmode shapes between air and water that leads to a large decrease in their modal stiffness in water as compared to air as well as a decrease in their optical lever sensitivity. These results are explained in terms of hydrodynamic interactions of microcantilevers with nonuniform mass distribution. The results clearly demonstrate that tip mass and hydrodynamic loading must be taken into account in stiffness calibration and optical lever sensitivity calibration while using higher-order eigenmodes in dynamic AFM.

  11. Cantilever spring constant calibration using laser Doppler vibrometry

    SciTech Connect

    Ohler, Benjamin

    2007-06-15

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  12. Calibration of the effective spring constant of ultra-short cantilevers for a high-speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Song, Yun-Peng; Wu, Sen; Xu, Lin-Yan; Zhang, Jun-Ming; Dorantes-Gonzalez, Dante J.; Fu, Xing; Hu, Xiao-Dong

    2015-06-01

    Ultra-short cantilevers are a new type of cantilever designed for the next generation of high-speed atomic force microscope (HS-AFM). Ultra-short cantilevers have smaller dimensions and higher resonant frequency than conventional AFM cantilevers. Moreover, their geometry may also be different from the conventional beam-shape or V-shape. These changes increase the difficulty of determining the spring constant for ultra-short cantilevers, and hence limit the accuracy and precision of force measurement based on a HS-AFM. This paper presents an experimental method to calibrate the effective spring constant of ultra-short cantilevers. By using a home-made AFM head, the cantilever is bent against an electromagnetic compensation balance under servo control. Meanwhile the bending force and the cantilever deflection are synchronously measured by the balance and the optical lever in the AFM head, respectively. Then the effective spring constant is simply determined as the ratio of the force to the corresponding deflection. Four ultra-short trapezoid shape cantilevers were calibrated using this method. A quantitative uncertainty analysis showed that the combined relative standard uncertainty of the calibration result is less than 2%, which is better than the uncertainty of any previously reported techniques.

  13. Technology for fabrication of a micromagnet on a tip of a MFM/MRFM probe

    DOEpatents

    Pelekhov, Denis V.; Hammel, P. Chris; Nunes, Jr., Geoffrey; Midzor, Melissa M.; Roukes, Michael

    2004-01-13

    A method for coating the tip of a mechanical resonator for use in magnetic force microscopy and magnetic resonance force microscopy in which the tip is coated with a ferromagnetic material and the cantilever is not, and the product resulting from the method. A cantilever and incorporated tip are coated with a photoresist, except that surface tension keeps photoresist off the tip. The cantilever and tip are then coated with a magnetic material. Next, acetone is used to lift off the magnetic material from the cantilever but not from the tip.

  14. Improved single molecule force spectroscopy using micromachined cantilevers.

    PubMed

    Bull, Matthew S; Sullan, Ruby May A; Li, Hongbin; Perkins, Thomas T

    2014-05-27

    Enhancing the short-term force precision of atomic force microscopy (AFM) while maintaining excellent long-term force stability would result in improved performance across multiple AFM modalities, including single molecule force spectroscopy (SMFS). SMFS is a powerful method to probe the nanometer-scale dynamics and energetics of biomolecules (DNA, RNA, and proteins). The folding and unfolding rates of such macromolecules are sensitive to sub-pN changes in force. Recently, we demonstrated sub-pN stability over a broad bandwidth (Δf = 0.01-16 Hz) by removing the gold coating from a 100 μm long cantilever. However, this stability came at the cost of increased short-term force noise, decreased temporal response, and poor sensitivity. Here, we avoided these compromises while retaining excellent force stability by modifying a short (L = 40 μm) cantilever with a focused ion beam. Our process led to a ∼10-fold reduction in both a cantilever's stiffness and its hydrodynamic drag near a surface. We also preserved the benefits of a highly reflective cantilever while mitigating gold-coating induced long-term drift. As a result, we extended AFM's sub-pN bandwidth by a factor of ∼50 to span five decades of bandwidth (Δf ≈ 0.01-1000 Hz). Measurements of mechanically stretching individual proteins showed improved force precision coupled with state-of-the-art force stability and no significant loss in temporal resolution compared to the stiffer, unmodified cantilever. Finally, these cantilevers were robust and were reused for SFMS over multiple days. Hence, we expect these responsive, yet stable, cantilevers to broadly benefit diverse AFM-based studies. PMID:24670198

  15. Multi-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experiment

    SciTech Connect

    Boularas, A. Baudoin, F.; Villeneuve-Faure, C.; Clain, S.; Teyssedre, G.

    2014-08-28

    Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis of stored charge quantities, measurements using an Atomic Force Microscope (AFM) must go with an appropriate simulation of electrostatic forces at play in the method. This is the objective of this work, where simulation results for the electrostatic force between an AFM sensor and the dielectric surface are presented for different bias voltages on the tip. The aim is to analyse force-distance curves modification induced by electrostatic charges. The sensor is composed by a cantilever supporting a pyramidal tip terminated by a spherical apex. The contribution to force from cantilever is neglected here. A model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator—PRO-scheme. First results of the computation of electrostatic force for different tip–sample distances (from 0 to 600 nm) and for different DC voltages applied to the tip (6 to 20 V) are shown and compared with experimental data in order to validate our approach.

  16. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

    SciTech Connect

    Chung, Koo-Hyun; Reitsma, Mark G.

    2010-02-15

    This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

  17. Piezoresistive cantilever based nanoflow and viscosity sensor for microchannels.

    PubMed

    Quist, Arjan; Chand, Ami; Ramachandran, Srinivasan; Cohen, Dan; Lal, Ratnesh

    2006-11-01

    Microfluidic channels are microreactors with a wide range of applications, including molecular separations based upon micro/nanoscale physicochemical properties, targeting and delivery of small amount of fluids and molecules, and patterned/directed growth. Their successful applications would require a detailed understanding of phenomena associated with the microscale flow of liquids through these channels, including velocity, viscosity and miscibility. Here we demonstrate a highly sensitive piezoresistive cantilever to measure flow properties in microfluidic channels. By milling down the legs of the piezoresistive cantilevers, we have achieved significantly higher mechanical sensitivity and a smaller spring constant, as determined by AFM. These cantilevers were used in microchannels to measure the viscosity and flow rate of ethylene glycol mixtures in water over a range of concentrations, as well as of low viscosity biologically relevant buffers with different serum levels. The sensor can be used alone or can be integrated in AFM systems for multidimensional study in micro and nanochannels. PMID:17066169

  18. Low temperature scanning force microscopy using piezoresistive cantilevers

    NASA Astrophysics Data System (ADS)

    Meiser, P.; Koblischka, M. R.; Hartmann, U.

    2015-08-01

    A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

  19. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  20. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    PubMed

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell. PMID:24007072

  1. Fabrication of wear-resistant silicon microprobe tips for high-speed surface roughness scanning devices

    NASA Astrophysics Data System (ADS)

    Wasisto, Hutomo Suryo; Yu, Feng; Doering, Lutz; Völlmeke, Stefan; Brand, Uwe; Bakin, Andrey; Waag, Andreas; Peiner, Erwin

    2015-05-01

    Silicon microprobe tips are fabricated and integrated with piezoresistive cantilever sensors for high-speed surface roughness scanning systems. The fabrication steps of the high-aspect-ratio silicon microprobe tips were started with photolithography and wet etching of potassium hydroxide (KOH) resulting in crystal-dependent micropyramids. Subsequently, thin conformal wear-resistant layer coating of aluminum oxide (Al2O3) was demonstrated on the backside of the piezoresistive cantilever free end using atomic layer deposition (ALD) method in a binary reaction sequence with a low thermal process and precursors of trimethyl aluminum and water. The deposited Al2O3 layer had a thickness of 14 nm. The captured atomic force microscopy (AFM) image exhibits a root mean square deviation of 0.65 nm confirming the deposited Al2O3 surface quality. Furthermore, vacuum-evaporated 30-nm/200-nm-thick Au/Cr layers were patterned by lift-off and served as an etch mask for Al2O3 wet etching and in ICP cryogenic dry etching. By using SF6/O2 plasma during inductively coupled plasma (ICP) cryogenic dry etching, micropillar tips were obtained. From the preliminary friction and wear data, the developed silicon cantilever sensor has been successfully used in 100 fast measurements of 5- mm-long standard artifact surface with a speed of 15 mm/s and forces of 60-100 μN. Moreover, the results yielded by the fabricated silicon cantilever sensor are in very good agreement with those of calibrated profilometer. These tactile sensors are targeted for use in high-aspect-ratio microform metrology.

  2. Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity

    NASA Astrophysics Data System (ADS)

    Yurtsever, Ayhan; Sugimoto, Yoshiaki; Tanaka, Hideki; Abe, Masayuki; Morita, Seizo; Ondráček, Martin; Pou, Pablo; Pérez, Rubén; Jelínek, Pavel

    2013-04-01

    We report force mapping experiments on Si(111)-(7×7) surfaces with adsorbed hydrogen, using atomic force microscopy at room temperature supported by density functional theory (DFT) simulations. On the basis of noncontact atomic force microscopy (NC-AFM) images as well as force versus distance curves measured over both hydrogen-passivated and bare Si adatoms, we identified two types of tip termination, which result in different modes of interaction with the surface. The statistics of the tip dependence of the measured forces, which are effectuated using various tip states with different cantilevers, reveal the typical values of the force and their distribution in the two characteristic interaction modes. The experimental results are corroborated by DFT calculations performed for different tip structures. As a reactive tip, the dimer-terminated Si tip yields results in satisfactory agreement with experimental force curves for hydrogen-passivated and nonpassivated Si adatom sites. An oxidized Si dimer tip that bears a hydroxyl group on its apex reproduces well the experimental force curves acquired by nonreactive tips. This tip model could thus be used to interpret the experimentally obtained weak image contrast for the Si(111)-(7×7) surface. The forces are thought to arise as a result of a weak electrostatic interaction involving a permanent dipole at the tip apex enhanced by the charge density redistribution due to the interaction with surface adatoms.

  3. Self-actuated, self-sensing cantilever for fast CD measurement

    NASA Astrophysics Data System (ADS)

    Ahmad, Ahmad; Ivanov, Tzvetan; Reum, Alexander; Guliyev, Elshad; Angelov, Tihomir; Schuh, Andreas; Kaestner, Marcus; Atanasov, Ivaylo; Hofer, Manuel; Holz, Mathias; Rangelow, Ivo W.

    2015-03-01

    The conventional optical lever detection technique involves optical components and its precise mechanical alignment. An additional technical limit is the weight of the optical system, in case a top-scanner is used in high speed and high precision metrology. An alternative represents the application of self-actuated AFM cantilevers with integrated 2DEG piezoresistive deflection sensors. A significant improvement in performance of such cantilevers with respect to deflection sensitivity and temperature stability has been achieved by using an integrated Wheatstone bridge configuration. Due to employing effective cross-talk isolation and temperature drift compensation the performance of these cantilevers was significantly improved. In order to enhance the speed of AFM measurements we are presenting a fast cantilever-approach technology, Q-factor-control and novel adaptive scanning speed procedure. Examples of AFM measurements with high scanning speed (up to 200 lines/s) committed to advanced lithography process development are shown.

  4. A Weed Cantilever

    ERIC Educational Resources Information Center

    Keller, Elhannan L.; Padalino, John

    1977-01-01

    Describes the Environmental Action Task activity, which may be used as a recreational game or an environmental perception experience, may be conducted indoors or out-of-doors, using weed stems (or spaghetti) and masking tape to construct a cantilever. Small groups of children work together to make the cantilever with the longest arm. Further…

  5. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    NASA Astrophysics Data System (ADS)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  6. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers.

    PubMed

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian; Paris, Oskar

    2016-01-01

    We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  7. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

    PubMed Central

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian

    2016-01-01

    Summary We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  8. Membrane-based actuation for high-speed single molecule force spectroscopy studies using AFM.

    PubMed

    Sarangapani, Krishna; Torun, Hamdi; Finkler, Ofer; Zhu, Cheng; Degertekin, Levent

    2010-07-01

    Atomic force microscopy (AFM)-based dynamic force spectroscopy of single molecular interactions involves characterizing unbinding/unfolding force distributions over a range of pulling speeds. Owing to their size and stiffness, AFM cantilevers are adversely affected by hydrodynamic forces, especially at pulling speeds >10 microm/s, when the viscous drag becomes comparable to the unbinding/unfolding forces. To circumvent these adverse effects, we have fabricated polymer-based membranes capable of actuating commercial AFM cantilevers at speeds >or=100 microm/s with minimal viscous drag effects. We have used FLUENT, a computational fluid dynamics (CFD) software, to simulate high-speed pulling and fast actuation of AFM cantilevers and membranes in different experimental configurations. The simulation results support the experimental findings on a variety of commercial AFM cantilevers and predict significant reduction in drag forces when membrane actuators are used. Unbinding force experiments involving human antibodies using these membranes demonstrate that it is possible to achieve bond loading rates >or=10(6) pN/s, an order of magnitude greater than that reported with commercial AFM cantilevers and systems. PMID:20054686

  9. Shear force microscopy using piezoresistive cantilevers in surface metrology

    NASA Astrophysics Data System (ADS)

    Gotszalk, Teodor; Kopiec, Daniel; Sierakowski, Andrzej; Janus, Paweł; Grabiec, Piotr; Rangelow, Ivo W.

    2014-09-01

    In this article we describe application of piezoresistive cantilevers in surface investigations carried out with the use of shear force microscopy (ShFM). The novel piezoresistive cantilevers integrate a Wheatstone piezoresistive bridge was used to detect the cantilever deflection, thermal deflection detector and planar tip protruding out of the spring beam. Because the planar tip deflection can be detected and controlled electronically the described technology is very flexible and can be applied in many surface investigations. In this article we will present operation theory of the described solution, experimental setup, methods for calibration of the tip deflection detection and actuation The analysis will be illustrated with example results of topography measurements performed using the described technology.

  10. Transient eigenmodes analysis of single-impact cantilever dynamics combining Fourier and wavelet transforms.

    PubMed

    Pukhova, Valentina; Banfi, Francesco; Ferrini, Gabriele

    2015-05-01

    The transient eigenmode structure of an interacting cantilever during a single impact on different surfaces evidences the excitation of higher flexural modes and low frequency oscillations. The frequency shift of the fundamental mode after the tip comes into contact with the sample surface allows calculating the tip-sample interaction stiffness and evidences the role of capillary condensation and surface wettability on the cantilever dynamics. Wavelet transforms are used to trace the origin of spectral features in the cantilever spectra and calculate force gradients of the tip-sample interaction. PMID:25837684

  11. Intrinsic dissipation in atomic force microscopy cantilevers.

    PubMed

    Zypman, Fredy

    2011-07-01

    In this paper we build a practical modification to the standard Euler-Bernoulli equation for flexural modes of cantilever vibrations most relevant for operation of AFM in high vacuum conditions. This is done by the study of a new internal dissipation term into the Euler-Bernoulli equation. This term remains valid in ultra-high vacuum, and becomes particularly relevant when viscous dissipation with the fluid environment becomes negligible. We derive a compact explicit equation for the quality factor versus pressure for all the flexural modes. This expression is used to compare with corresponding extant high vacuum experiments. We demonstrate that a single internal dissipation parameter and a single viscosity parameter provide enough information to reproduce the first three experimental flexural resonances at all pressures. The new term introduced here has a mesoscopic origin in the relative motion between adjacent layers in the cantilever. PMID:21741914

  12. Lateral force microscope calibration using a modified atomic force microscope cantilever

    SciTech Connect

    Reitsma, M. G.

    2007-10-15

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.

  13. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    PubMed

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids. PMID:26402914

  14. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  15. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy.

    PubMed

    Loganathan, Muthukumaran; Bristow, Douglas A

    2014-04-01

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields. PMID:24784614

  16. Imaging and manipulation of nanoscale materials with coaxial and triaxial AFM probes

    NASA Astrophysics Data System (ADS)

    Brown, Keith A.; Westervelt, R. M.

    2011-03-01

    We present coaxial and triaxial Atomic Force Microscope (AFM) probes and demonstrate their applications to imaging and manipulating nanoscale materials. A coaxial probe with concentric electrodes at its tip creates a highly confined electric field that decays as a dipole field, making the coaxial probe useful for near field imaging of electrical properties. We show nearly an order of magnitude improvement in the step resolution of Kelvin probe force microscopy with coaxial probes. We further demonstrate that coaxial probes can image dielectric materials with the dielectrophoretic force. In addition to imaging, the capacitive structure that makes up the cantilever of a coaxial probe is used to locally mechanically drive the probe, making them self-driving probes. Finally, coaxial probes can create strong forces with dielectrophoresis (DEP) which we combine with the nanometer precision of the AFM to create a nanometer scale pick-and-place tool. We demonstrate 3D assembly of micrometer scale objects with coaxial probes using positive DEP and discuss the assembly of nanometer scale objects with triaxial probes using negative DEP.

  17. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    SciTech Connect

    Baumann, Fabian; Pippig, Diana A. Gaub, Hermann E.; Heucke, Stephan F.

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  18. Tuning the Spring Constant of Cantilever-free Probe Arrays

    NASA Astrophysics Data System (ADS)

    Eichelsdoerfer, Daniel J.; Brown, Keith A.; Boya, Radha; Shim, Wooyoung; Mirkin, Chad A.

    2013-03-01

    The versatility of atomic force microscope (AFM) based techniques such as scanning probe lithography is due in part to the utilization of a cantilever that can be fabricated to match a desired application. In contrast, cantilever-free scanning probe lithography utilizes a low cost array of probes on a compliant backing layer that allows for high throughput nanofabrication but lacks the tailorability afforded by the cantilever in traditional AFM. Here, we present a method to measure and tune the spring constant of probes in a cantilever-free array by adjusting the mechanical properties of the underlying elastomeric layer. Using this technique, we are able to fabricate large-area silicon probe arrays with spring constants that can be tuned in the range from 7 to 150 N/m. This technique offers an advantage in that the spring constant depends linearly on the geometry of the probe, which is in contrast to traditional cantilever-based lithography where the spring constant varies as the cube of the beam width and thickness. To illustrate the benefit of utilizing a probe array with a lower spring constant, we pattern a block copolymer on a delicate 50 nm thick silicon nitride window.

  19. Electroless deposition of silver onto silicon as a method of preparation of reproducible surface-enhanced Raman spectroscopy substrates and tip-enhanced Raman spectroscopy tips.

    PubMed

    Brejna, Przemysław R; Griffiths, Peter R

    2010-05-01

    A simple method for the production of silver nanoparticles on a silicon substrate that is suitable for surface-enhanced Raman spectroscopy (SERS) is presented. The method is based on spontaneous reduction of Ag(+) ions by elemental silicon. The oxide layer is removed from the surface of a silicon disk by etching with dilute HF that is present in the same dilute solution of silver nitrate that is used to form the silver nanoparticles. By controlling the concentrations of HF and AgNO(3), the morphology of the deposited silver nanostructures can be varied dramatically. The reproducibility of SERS measurements for substrates produced with a given concentration of HF and AgNO(3) is good (relative standard deviation approximately 10%). The application was extended to coating the tips of silicon cantilevers designed for atomic force microscopy (AFM) with silver nanoparticles to permit measurements of tip-enhanced Raman spectra (TERS). The feasibility of TERS measurements with AFM tips prepared in this way is demonstrated. PMID:20482967

  20. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  1. Calibration of the lateral spring constant of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-10-01

    Atomic force microscope (AFM) is very useful in nano-scale force measurement. Lateral force is typically used in nanoscratch and surface friction measurement based on AFM. As one of the most important parameters to obtain lateral force, the lateral spring constant of AFM cantilever probe is of great significance and needs to be quantitative calibrated. Lateral torsion and lateral force of the cantilever are two parameters need to be measured in lateral spring constant calibration. In this article, we develop a calibration system and introduce a calibration method using an AFM head and an electromagnetic balance. An aluminium column with a known angel on top is placed on the weighing pan of the balance. The cantilever is precisely positioned in the AFM head, then approaches and bends on the aluminium column. During this procedure, the bending force and the lateral torsion of the cantilever are synchronously measured by the balance and an optical lever system, respectively. Then the lateral spring constant is calculated with a formula. By using this method, three kinds of rectangular cantilever are calibrated. The relative standard deviations of the calibration results are smaller than 2%.

  2. Calibration of higher eigenmodes of cantilevers

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

  3. Calibration of higher eigenmodes of cantilevers.

    PubMed

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem. PMID:27475563

  4. In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude

    PubMed Central

    de Laat, Marcel Lambertus Cornelis; Pérez Garza, Héctor Hugo; Ghatkesar, Murali Krishna

    2016-01-01

    The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust the stiffness in situ of a commercial AFM cantilever is developed. The adjustment is achieved by changing the effective length of the cantilever by electrostatic pull-in. By applying a voltage between the cantilever and an electrode (with an insulating layer at the point of contact), the cantilever snaps to the electrode, reducing the cantilever’s effective length. An analytical model was developed to find the pull-in voltage of the system. Subsequently, a finite element model was developed to study the pull-in behavior. The working principle of this concept is demonstrated with a proof-of-concept experiment. The electrode was positioned close to the cantilever by using a robotic nanomanipulator. To confirm the change in stiffness, the fundamental resonance frequency of the cantilever was measured for varying electrode positions. The results match with the theoretical expectations. The stiffness was adjusted in situ in the range of 0.2 N/m to 27 N/m, covering two orders of magnitude in one single cantilever. This proof-of-concept is the first step towards a micro fabricated prototype, that integrates the electrode positioning system and cantilever that can be used for actual AFM experiments. PMID:27077863

  5. AFM study of polymer lubricants on hard disk surfaces

    NASA Astrophysics Data System (ADS)

    Bao, G. W.; Troemel, M.; Li, S. F. Y.

    Thin liquid films of PFPE (perfluoropolyether) lubricants dip-coated on hard disk surfaces were imaged with non-contact mode AFM. Demnum lubricants with phosphazene additives exhibited strong interactions with a silicon tip due to the formation of liquid bridges between the lubricants and the tip, as indicated by a remarkable hysteresis loop between approach and retraction curves in force vs. distance measurements. Features resulting from capillary forces due to tip tapping to the lubricants were revealed, which demonstrated that the capillary forces could be used to lock the non-contacting tip at a certain separation from the substrate surface to obtain AFM images. Force vs. distance curves for Fomblin Z-dol lubricants showed negligible hysteresis effects and features corresponding to lateral distortion of the tip by the lubricants only were observed. In both cases, only when the tip was positioned far above the surfaces could the natural distributions of the lubricants be imaged.

  6. Parametric effects in nanobeams and AFM

    SciTech Connect

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-10

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  7. Parametric effects in nanobeams and AFM

    NASA Astrophysics Data System (ADS)

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-01

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  8. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  9. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST BANK SIDE LOOKING NORTHWEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  10. Multi-directional energy harvesting by piezoelectric cantilever-pendulum with internal resonance

    SciTech Connect

    Xu, J.; Tang, J.

    2015-11-23

    This letter reports a piezoelectric cantilever-pendulum design for multi-directional energy harvesting. A pendulum is attached to the tip of a piezoelectric cantilever-type energy harvester. This design aims at taking advantage of the nonlinear coupling between the pendulum motion in 3-dimensional space and the beam bending vibration at resonances. Experimental studies indicate that, under properly chosen parameters, 1:2 internal resonance can be induced, which enables the multi-directional energy harvesting with a single cantilever. The advantages of the design with respect to traditional piezoelectric cantilever are examined.

  11. Multi-directional energy harvesting by piezoelectric cantilever-pendulum with internal resonance

    NASA Astrophysics Data System (ADS)

    Xu, J.; Tang, J.

    2015-11-01

    This letter reports a piezoelectric cantilever-pendulum design for multi-directional energy harvesting. A pendulum is attached to the tip of a piezoelectric cantilever-type energy harvester. This design aims at taking advantage of the nonlinear coupling between the pendulum motion in 3-dimensional space and the beam bending vibration at resonances. Experimental studies indicate that, under properly chosen parameters, 1:2 internal resonance can be induced, which enables the multi-directional energy harvesting with a single cantilever. The advantages of the design with respect to traditional piezoelectric cantilever are examined.

  12. Intermittent contact interaction between an atomic force microscope cantilever and a nanowire

    NASA Astrophysics Data System (ADS)

    Knittel, I.; Ungewitter, L.; Hartmann, U.

    2012-05-01

    We investigate in theory and experiment the intermittent contact interaction between an atomic force microscope (AFM) cantilever and a nanowire under ambient conditions. The nanowire is modeled as a spring reacting instantaneously to any change of the force between the wire and the cantilever. This implies that the cantilever is subject to an "effective" force-distance relation, containing not only the surface forces but also the deflection of the nanowire. Experimentally, CVD-grown tin oxide nanowires and lithographically structured silicon nanowire arrays were investigated by intermittent contact AFM. By comparison of experimental and simulated distance-dependent resonance curves it is found that the nanowires behave like "fast nanosprings" and that the adhesion force is one of the key factors determining distance-dependent resonance curves. The results are fully applicable to a scenario in which a cantilever equipped by a nanowire interacts with a surface.

  13. High-Gradient Nanomagnets on Cantilevers for Sensitive Detection of Nuclear Magnetic Resonance

    PubMed Central

    Longenecker, Jonilyn G.; Mamin, H. J.; Senko, Alexander W.; Chen, Lei; Rettner, Charles T.; Rugar, Daniel; Marohn, John A.

    2012-01-01

    Detection of magnetic resonance as a force between a magnetic tip and nuclear spins has previously been shown to enable sub-10 nm resolution 1H imaging. Maximizing the spin force in such a magnetic resonance force microscopy (MRFM) experiment demands a high field gradient. In order to study a wide range of samples, it is equally desirable to locate the magnetic tip on the force sensor. Here we report the development of attonewton-sensitivity cantilevers with high gradient cobalt nanomagnet tips. The damage layer thickness and saturation magnetization of the magnetic material were characterized by X-ray photoelectron spectroscopy and superconducting quantum interference device magnetometry. The coercive field and saturation magnetization of an individual tip were quantified in situ using frequency-shift cantilever magnetometry. Measurements of cantilever dissipation versus magnetic field and tip-sample separation were conducted. MRFM signals from protons in a polystyrene film were studied versus rf irradiation frequency and tip-sample separation, and from this data the tip field and tip-field gradient were evaluated. Magnetic tip performance was assessed by numerically modeling the frequency dependence of the magnetic resonance signal. We observed a tip-field gradient ∂Bztip∕∂z estimated to be between 4.4 and 5.4 MT m−1, which is comparable to the gradient used in recent 4 nm resolution 1H imaging experiments and larger by nearly an order of magnitude than the gradient achieved in prior magnet-on-cantilever MRFM experiments. PMID:23033869

  14. Radiation pressure excitation of Low Temperature Atomic Force & Magnetic Force Microscope (LT-AFM/MFM) for Imaging

    NASA Astrophysics Data System (ADS)

    Karci, Ozgur; Celik, Umit; Oral, Ahmet; NanoMagnetics Instruments Ltd. Team; Middle East Tech Univ Team

    2015-03-01

    We describe a novel method for excitation of Atomic Force Microscope (AFM) cantilevers by means of radiation pressure for imaging in an AFM for the first time. Piezo excitation is the most common method for cantilever excitation, but it may cause spurious resonance peaks. A fiber optic interferometer with 1310 nm laser was used both to measure the deflection of cantilever and apply a force to the cantilever in a LT-AFM/MFM from NanoMagnetics Instruments. The laser power was modulated at the cantilever`s resonance frequency by a digital Phase Lock Loop (PLL). The force exerted by the radiation pressure on a perfectly reflecting surface by a laser beam of power P is F = 2P/c. We typically modulate the laser beam by ~ 800 μW and obtain 10nm oscillation amplitude with Q ~ 8,000 at 2.5x10-4 mbar. The cantilever's stiffness can be accurately calibrated by using the radiation pressure. We have demonstrated performance of the radiation pressure excitation in AFM/MFM by imaging a hard disk sample between 4-300K and Abrikosov vortex lattice in BSCCO single crystal at 4K to for the first time.

  15. Self-sensing atomic force microscopy cantilevers based on tunnel magnetoresistance sensors

    NASA Astrophysics Data System (ADS)

    Tavassolizadeh, Ali; Meier, Tobias; Rott, Karsten; Reiss, Günter; Quandt, Eckhard; Hölscher, Hendrik; Meyners, Dirk

    2013-04-01

    Here, we introduce self-sensing cantilevers for atomic force microscopy (AFM) based on tunnel magnetoresistance (TMR) sensors. These TMR sensors are integrated into the AFM cantilevers and consist of a magnetically stable layer and a sensing magnetostrictive CoFeB layer separated by a MgO tunneling barrier and can be as small as 10 μm × 10 μm. Their TMR values and resistance-area products are about 121% and 61 kΩμm2, respectively. A comparison of AFM data simultaneously obtained with a self-sensing cantilever with a 37 μm × 37 μm large TMR sensor and the conventional optical beam deflection method revealed the same data quality.

  16. Fast atomic force microscopy with self-transduced, self-sensing cantilever

    NASA Astrophysics Data System (ADS)

    Ahmad, Ahmad; Ivanov, Tzvetan; Angelov, Tihomir; Rangelow, Ivo W.

    2015-07-01

    The conventional optical lever detection technique involves optical components and their precise mechanical alignment. An additional technical limit is the weight of the optical system in cases where a top-scanner is used with high-speed and high-precision metrology. An alternative represents the application of self-actuated atomic force microscopy (AFM) cantilevers with integrated two-dimensional electron gas (2-DEG) piezoresistive deflection sensors. A significant improvement in the performance of such cantilevers with respect to deflection sensitivity and temperature stability has been achieved by using an integrated Wheatstone bridge configuration. Due to employing effective crosstalk isolation and temperature drift compensation, the performance of these cantilevers was significantly improved. In order to enhance the speed of AFM measurements, we present an adaptive scanning speed procedure. Examples of AFM measurements with a high scanning speed (up to 200 lines/s) committed to advanced lithography process development are shown.

  17. Selective enhancement of individual cantilever high resonance modes.

    PubMed

    Penedo, Marcos; Hormeño, Silvia; Prieto, Patricia; Alvaro, Raquel; Anguita, José; Briones, Fernando; Luna, Mónica

    2015-12-01

    Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga(+) ion implantation in the specific areas of the magnetic material. PMID:26559931

  18. Selective enhancement of individual cantilever high resonance modes

    NASA Astrophysics Data System (ADS)

    Penedo, Marcos; Hormeño, Silvia; Prieto, Patricia; Alvaro, Raquel; Anguita, José; Briones, Fernando; Luna, Mónica

    2015-12-01

    Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga+ ion implantation in the specific areas of the magnetic material.

  19. Investigation of polymer derived ceramics cantilevers for application of high speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Wu, Chia-Yun

    High speed Atomic Force Microscopy (AFM) has a wide variety of applications ranging from nanomanufacturing to biophysics. In order to have higher scanning speed of certain AFM modes, high resonant frequency cantilevers are needed; therefore, the goal of this research is to investigate using polymer derived ceramics for possible applications in making high resonant frequency AFM cantilevers using complex cross sections. The polymer derived ceramic that will be studied, is silicon carbide. Polymer derived ceramics offer a potentially more economic fabrication approach for MEMS due to their relatively low processing temperatures and ease of complex shape design. Photolithography was used to make the desired cantilever shapes with micron scale size followed by a wet etching process to release the cantilevers from the substrates. The whole manufacturing process we use borrow well-developed techniques from the semiconducting industry, and as such this project also could offer the opportunity to reduce the fabrication cost of AFM cantilevers and MEMS in general. The characteristics of silicon carbide made from the precursor polymer, SMP-10 (Starfire Systems), were studied. In order to produce high qualities of silicon carbide cantilevers, where the major concern is defects, proper process parameters needed to be determined. Films of polymer derived ceramics often have defects due to shrinkage during the conversion process. Thus control of defects was a central issue in this study. A second, related concern was preventing oxidation; the polymer derived ceramics we chose is easily oxidized during processing. Establishing an environment without oxygen in the whole process was a significant challenge in the project. The optimization of the parameters for using photolithography and wet etching process was the final and central goal of the project; well established techniques used in microfabrication were modified for use in making the cantilever in the project. The techniques

  20. Measuring the cantilever-position-sensitive detector distance and cantilever curvature for cantilever sensor applications.

    PubMed

    Xu, Meng; Tian, Ye; Coates, M L; Beaulieu, L Y

    2009-09-01

    Measuring cantilever sensor deflections using an optical beam deflection system is more complicated than often assumed. The direction of the reflected beam is dependent on the surface normal of the cantilever, which in turn is dependent on the state of the cantilever. It is often assumed that the cantilever is both straight and perfectly level before the onset of sensing experiments although this assumption, especially the former, is rarely true. Failure to characterize the initial state of the cantilever can lead to irreproducibility in cantilever sensor measurements. We have developed three new methods for characterizing the initial state of the cantilever. In the first case we show how to define the initial angle of inclination beta of the chip on which the cantilever is attached. This method was tested using an aluminum block with a known angle of inclination. A new method for determining the initial distance L(o) between the cantilever and the position-sensitive detector (PSD) is also presented. This parameter which behaves as an amplification factor of the PSD signal is critical for obtaining precise cantilever sensor data. Lastly, we present a method for determining the initial curvature of the cantilever which often results from depositing the sensing platform on the lever. Experiments conducted using deflected cantilevers showed the model to be accurate. The characterization methods presented in this work are simple to use, easy to implement, and can be incorporated into most cantilever sensor setups. PMID:19791971

  1. Microfabrication of a combined AFM-SNOM sensor

    PubMed

    Schurmann; Noell; Staufer; de Rooij NF

    2000-02-01

    The objective of this work is to fabricate a scanning probe sensor that combines the well-established method for atomic force microscopy, employing a micro-machined Si cantilever and integrated tip, with a probe for the optical near field. A photosensitive pn-junction is integrated into the tip for that purpose and an Al coating is applied to the tip. It comprises an aperture of 50-70 nm in diameter at the apex of the tip in order to spatially limit the interaction of the tip to the optical near field of the sample. Characterization of the tip and first results of simultaneously recorded force and photon images are presented. PMID:10741649

  2. Hard-tip, soft-spring lithography.

    PubMed

    Shim, Wooyoung; Braunschweig, Adam B; Liao, Xing; Chai, Jinan; Lim, Jong Kuk; Zheng, Gengfeng; Mirkin, Chad A

    2011-01-27

    Nanofabrication strategies are becoming increasingly expensive and equipment-intensive, and consequently less accessible to researchers. As an alternative, scanning probe lithography has become a popular means of preparing nanoscale structures, in part owing to its relatively low cost and high resolution, and a registration accuracy that exceeds most existing technologies. However, increasing the throughput of cantilever-based scanning probe systems while maintaining their resolution and registration advantages has from the outset been a significant challenge. Even with impressive recent advances in cantilever array design, such arrays tend to be highly specialized for a given application, expensive, and often difficult to implement. It is therefore difficult to imagine commercially viable production methods based on scanning probe systems that rely on conventional cantilevers. Here we describe a low-cost and scalable cantilever-free tip-based nanopatterning method that uses an array of hard silicon tips mounted onto an elastomeric backing. This method-which we term hard-tip, soft-spring lithography-overcomes the throughput problems of cantilever-based scanning probe systems and the resolution limits imposed by the use of elastomeric stamps and tips: it is capable of delivering materials or energy to a surface to create arbitrary patterns of features with sub-50-nm resolution over centimetre-scale areas. We argue that hard-tip, soft-spring lithography is a versatile nanolithography strategy that should be widely adopted by academic and industrial researchers for rapid prototyping applications. PMID:21270890

  3. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers.

    PubMed

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations. PMID:26684144

  4. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations.

  5. Defect reduction in gallium nitride using cantilever epitaxy.

    SciTech Connect

    Mitchell, Christine Charlotte

    2003-08-01

    Cantilever epitaxy (CE) has been developed to produce GaN on sapphire with low dislocation densities as needed for improved devices. The basic mechanism of seeding growth on sapphire mesas and lateral growth of cantilevers until they coalesce has been modified with an initial growth step at 950 C. This step produces a gable with (11{bar 2}2) facets over the mesas, which turns threading dislocations from vertical to horizontal in order to reduce the local density above mesas. This technique has produced material with densities as low as 2-3x10{sup 7}/cm{sup 2} averaged across extended areas of GaN on sapphire, as determined with AFM, TEM and cathodoluminescence (CL). This density is about two orders of magnitude below that of conventional planar growths; these improvements suggest that locating wide-area devices across both cantilever and mesa regions is possible. However, the first implementation of this technique also produced a new defect: cracks at cantilever coalescences with associated arrays of lateral dislocations. These defects have been labeled 'dark-block defects' because they are non-radiative and appear as dark rectangles in CL images. Material has been grown that does not have dark-block defects. Examination of the evolution of the cantilever films for many growths, both partial and complete, indicates that producing a film without these defects requires careful control of growth conditions and crystal morphology at multiple steps. Their elimination enhances optical emission and uniformity over large (mm) size areas.

  6. Conductive supports for combined AFM SECM on biological membranes

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Bosshart, Patrick D.; Akiyama, Terunobu; Chami, Mohamed; Gullo, Maurizio R.; Blackstock, Jason J.; Dooleweerdt, Karin; de Rooij, Nico F.; Staufer, Urs; Engel, Andreas

    2008-09-01

    Four different conductive supports are analysed regarding their suitability for combined atomic force and scanning electrochemical microscopy (AFM-SECM) on biological membranes. Highly oriented pyrolytic graphite (HOPG), MoS2, template stripped gold, and template stripped platinum are compared as supports for high resolution imaging of reconstituted membrane proteins or native membranes, and as electrodes for transferring electrons from or to a redox molecule. We demonstrate that high resolution topographs of the bacterial outer membrane protein F can be recorded by contact mode AFM on all four supports. Electrochemical feedback experiments with conductive cantilevers that feature nanometre-scale electrodes showed fast re-oxidation of the redox couple Ru(NH3)63+/2+ with the two metal supports after prolonged immersion in electrolyte. In contrast, the re-oxidation rates decayed quickly to unpractical levels with HOPG or MoS2 under physiological conditions. On HOPG we observed heterogeneity in the re-oxidation rate of the redox molecules with higher feedback currents at step edges. The latter results demonstrate the capability of conductive cantilevers with small electrodes to measure minor variations in an SECM signal and to relate them to nanometre-scale features in a simultaneously recorded AFM topography. Rapid decay of re-oxidation rate and surface heterogeneity make HOPG or MoS2 less attractive for combined AFM-SECM experiments on biological membranes than template stripped gold or platinum supports.

  7. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied – in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry – neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  8. [Physiological behavior of Cantilever].

    PubMed

    Feeldman, I; Frugone, R; Vládilo, N T

    1990-11-01

    The prosthetic rehabilitation is common of the integral treatment of patients that integral treatment of patients that have lost one or several dental pieces as a consequence of periodontal diseases. It has been demonstrated that plural fixed prothesis to extention, plovide a distribution pattern and magnitude of favourable forces to the periodontal during the different functions of the stomathologic apparatus, that justify rehabilitation based to it patients periodontically affected. The physiological behaviour of cantilever was basically analized on report on different investigation studies performed on patients periodontically diminis hed treated with plural fixed prothesis of crossed are with two unit or bilateral vear cantilever units, dento supported or fixed in place on implants. It is important to emphasize that favourable results previously analized in base to this type of rehabilitation in its different varieties have been obtained through record done on patients in which considerations of indications, design and occlusion stability have been optimized. PMID:2075270

  9. Measurement of Mechanical Properties of Cantilever Shaped Materials

    PubMed Central

    Finot, Eric; Passian, Ali; Thundat, Thomas

    2008-01-01

    Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to a differential stress can all be simultaneously determined for a cantilever. When measuring the mechanical properties of materials, identifying and discerning the most influential parameters responsible for the observed changes in the cantilever response are important. We will, therefore, discuss the effects of various force fields such as those induced by mass loading, residual stress, internal friction of the material, and other changes in the mechanical properties of the microcantilevers. Methods to measure variations in temperature, pressure, or molecular adsorption of water molecules are also discussed. Often these effects occur simultaneously, increasing the number of parameters that need to be concurrently measured to ensure the reliability of the sensors. We therefore systematically investigate the geometric and environmental effects on cantilever measurements including the chemical nature of the underlying interactions. To address the geometric effects we have considered cantilevers with a rectangular or circular cross section. The chemical nature is addressed by using cantilevers fabricated with metals and/or dielectrics. Selective chemical etching, swelling or changes in Young's modulus of the surface were investigated by means of polymeric and inorganic coatings. Finally to address the effect of the environment in which the cantilever operates, the Knudsen number was determined to characterize the molecule-cantilever collisions. Also bimaterial cantilevers with high thermal sensitivity were used to discern the effect of temperature variations. When appropriate

  10. Tuning the resonance of a photonic crystal microcavity with an AFM probe.

    PubMed

    Märki, Iwan; Salt, Martin; Herzig, Hans Peter

    2006-04-01

    We present theoretical and experimental results on switching and tuning of a two-dimensional photonic crystal resonant microcavity by means of a silicon AFM tip, probing the highly localized optical field in the vicinity of the cavity. On-off switching and modulation of the transmission signal in the kHz range is achieved by bringing an AFM tip onto the center of the microcavity, inducing a damping effect on the transmission resonance. Tuning of the resonant wavelength in the order of several nanometers becomes possible by inserting the AFM tip into one of the holes of the Bragg mirror forming the microcavity in the propagation direction. PMID:19516436

  11. 77 FR 826 - Cantilever Capital, LLC and Cantilever Group, LLC; Notice of Application

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-01-06

    ... COMMISSION Cantilever Capital, LLC and Cantilever Group, LLC; Notice of Application December 29, 2011. AGENCY...)(3) of the Act. Applicants: Cantilever Capital, LLC (``Cantilever'' or the ``Company'') and Cantilever Group, LLC (the ``Adviser''). Summary of Application: Cantilever, or any successor to...

  12. Nanoscale structural features determined by AFM for single virus particles.

    PubMed

    Chen, Shu-wen W; Odorico, Michael; Meillan, Matthieu; Vellutini, Luc; Teulon, Jean-Marie; Parot, Pierre; Bennetau, Bernard; Pellequer, Jean-Luc

    2013-11-21

    In this work, we propose "single-image analysis", as opposed to multi-image averaging, for extracting valuable information from AFM images of single bio-particles. This approach allows us to study molecular systems imaged by AFM under general circumstances without restrictions on their structural forms. As feature exhibition is a resolution correlation, we have performed AFM imaging on surfaces of tobacco mosaic virus (TMV) to demonstrate variations of structural patterns with probing resolution. Two AFM images were acquired with the same tip at different probing resolutions in terms of pixel width, i.e., 1.95 and 0.49 nm per pixel. For assessment, we have constructed an in silico topograph based on the three-dimensional crystal structure of TMV as a reference. The prominent artifacts observed in the AFM-determined shape of TMV were attributed to tip convolutions. The width of TMV rod was systematically overestimated by ~10 nm at both probing resolutions of AFM. Nevertheless, the effects of tip convolution were less severe in vertical orientation so that the estimated height of TMV by AFM imaging was in close agreement with the in silico X-ray topograph. Using dedicated image processing algorithms, we found that at low resolution (i.e., 1.95 nm per pixel), the extracted surface features of TMV can be interpreted as a partial or full helical repeat (three complete turns with ~7.0 nm in length), while individual protein subunits (~2.5 nm) were perceivable only at high resolution. The present study shows that the scales of revealed structural features in AFM images are subject to both probing resolution and processing algorithms for image analysis. PMID:24056758

  13. Viscoelasticity of gelatin surfaces probed by AFM noise analysis.

    PubMed

    Benmouna, Farida; Johannsmann, Diethelm

    2004-01-01

    The viscoelastic properties of surfaces of swollen gelatin were investigated by analyzing the Brownian motion of an atomic force microscopy (AFM) cantilever in contact with the gel surface. A micron-sized glass sphere attached to the AFM cantilever is used as the dynamic probe. When the sphere approaches the gelatin surface, there is a static repulsive force without a jump into contact. The cantilever's Brownian movement is monitored in parallel, providing access to the dynamic sphere-surface interaction as quantified by the dynamic spring constant, kappa, and the drag coefficient, xi. Gelatin is used as a model substance for a variety of other soft surfaces, where the stiffness of the gel can be varied via the solvent quality, the bloom number, and the pH. The modulus derived from the static force-distance curve is in the kPa range, consistent with the literature. However, the dynamic spring constant as derived from the Brownian motion is much larger than the static differential spring constant dF/dz. On retraction, one observes a rather strong adhesion hysteresis. The strength of the bridge (as given by the dynamic spring constant and the drag coefficient) is very small. PMID:15745019

  14. Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

    NASA Astrophysics Data System (ADS)

    Hoof, Sebastian; Nand Gosvami, Nitya; Hoogenboom, Bart W.

    2012-12-01

    Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here, we show that a high-quality resonance (Q >20) can be achieved in aqueous solution by attaching a microgram-bead at the end of the nanogram-cantilever. The resulting increase in cantilever mass causes the resonance frequency to drop significantly. However, the force sensitivity—as expressed via the minimum detectable force gradient—is hardly affected, because of the enhanced quality factor. Through the enhancement of the quality factor, the attached bead also reduces the relative importance of noise in the deflection detector. It can thus yield an improved signal-to-noise ratio when this detector noise is significant. We describe and analyze these effects for a set-up that includes magnetic actuation of the cantilevers and that can be easily implemented in any AFM system that is compatible with an inverted optical microscope.

  15. Simultaneous normal and torsional force measurement by cantilever surface contour analysis

    NASA Astrophysics Data System (ADS)

    Kumanchik, Lee; Schmitz, Tony; Pratt, Jon

    2011-05-01

    This study presents an alternative to the current Hooke's law-based force relation between rectangular cantilever deflection and applied force. In the new approach, a transduction constant is presented that (1) includes no cross-talk between torsion and normal force components, (2) is independent of the load application point, and (3) does not depend on the cantilever beam length. Rather than measuring the cantilever deformation at a single point (such as the tip location), it is measured at multiple adjacent points using scanning white light interferometry to provide a three-dimensional description of the cantilever deformation during loading. This measurement, processed by a force relation based on a superposition of deflections derived from Euler-Bernoulli bending theory and St Venant's torsion theory, provides the vertical, axial, and torsional force components simultaneously. Experimental results are compared to force predictions for the vertical and torsional components using macro-scale cantilevers under mass loading. An uncertainty analysis is also provided.

  16. Low frequency driven oscillations of cantilevers in viscous fluids at very low Reynolds number

    NASA Astrophysics Data System (ADS)

    Cranch, G. A.; Lane, J. E.; Miller, G. A.; Lou, J. W.

    2013-05-01

    The motion of submerged cantilevers driven by viscous fluids is experimentally investigated and a previously published theoretical model is verified over a broad range of Reynolds number covering 4×10-3≤Re≤2000 at frequencies up to 1 kHz. Both planar and cylindrical cantilevers are implemented using short length (few centimeters) fiber lasers, which are also used to measure the deflections. The driving forces are analyzed in detail illustrating how the dominant force transitions from a pressure related force to a viscous force depending on the Reynolds number of the fluid flow around the cantilever. Simplified, approximate expressions for the tip displacement of cantilevers oscillating in the highly viscous regime are also presented. These results will enable accurate, a priori, calculation of the motion of driven cantilevers over a range of dimensions, geometries, and fluid properties.

  17. A cantilever based optical fiber acoustic sensor fabricated by femtosecond laser micromachining

    NASA Astrophysics Data System (ADS)

    Liu, Jie; Yuan, Lei; Huang, Jie; Xiao, Hai

    2016-04-01

    In this paper, we present a pure silica micro-cantilever based optical fiber sensor for acoustic wave detection. The cantilever is directly fabricated by fs laser micromachining on an optical fiber tip functioning as an inline Fabry-Perot interferometer (FPI). The applied acoustic wave pressurizes the micro-cantilever beam and the corresponding dynamic signals can be probed by the FPI. The thickness, length, and width of the micro-cantilever beam can be flexibly designed and fabricated so that the sensitivity, frequency response, and the total measurement range can be varied to fit many practical applications. Experimental results will be presented and analyzed. Due to the assembly free fabrication of the fs-laser, multiple micro-cantilever beams could be potentially fabricated in/on a single optical fiber for quasi-distributed acoustic mapping with high spatial resolution.

  18. Gland With Cantilever Seal

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B.

    1989-01-01

    Single-piece gland forms tight seal on probe or tube containing liquid or gas at high pressure. Gland and probe align as assembled by simple torquing procedure. Disconnected easily and reused at same site. Made from any of wide variety of materials so compatible with application. Cantilever ring at top of gland bites into wall of tube or probe, sealing it. Wall of tube or probe must be thick enough to accommodate deformation without rupturing. Maximum deformation designed in coordination with seating and deformation of boss or conical seal.

  19. Experimental investigation of fatigue in a cantilever energy harvesting beam

    NASA Astrophysics Data System (ADS)

    Avvari, Panduranga Vittal; Yang, Yaowen; Liu, Peiwen; Soh, Chee Kiong

    2015-03-01

    Over the last decade, cantilever energy harvesters gained immense popularity owing to the simplicity of the design and piezoelectric energy harvesting (PEH) using the cantilever design has undergone considerable evolution. The major drawback of a vibrating cantilever beam is its vulnerability to fatigue over a period of time. This article brings forth an experimental investigation into the phenomenon of fatigue of a PEH cantilever beam. As there has been very little literature reported in this area, an effort has been made to scrutinize the damage due to fatigue in a linear vibrating cantilever PEH beam consisting of an aluminum substrate with a piezoelectric macro-fiber composite (MFC) patch attached near the root of the beam and a tip mass attached to the beam. The beam was subjected to transverse vibrations and the behavior of the open circuit voltage was recorded with passing time. Moreover, electro-mechanical admittance readings were obtained periodically using the same MFC patch as a Structural health monitoring (SHM) sensor to assess the health of the PEH beam. The results show that with passing time the PEH beam underwent fatigue in both the substrate and MFC, which is observed in a complimentary trend in the voltage and admittance readings. The claim is further supported using the variation of root mean square deviation (RMSD) of the real part of admittance (conductance) readings. Thus, this study concludes that the fatigue issue should be addressed in the design of PEH for long term vibration energy harvesting.

  20. Effect of finite width on deflection and energy release rate of an orthotropic double cantilever specimen

    NASA Technical Reports Server (NTRS)

    Schapery, R. A.; Davidson, B. D.

    1988-01-01

    The problem of an orthotropic cantilevered plate subjected to a uniformly distributed end load is solved by the Rayleigh-Ritz energy method. The result is applied to laminated composite, double cantilevered specimens to estimate the effect of crack tip constraint on the transverse curvature, deflection and energy release rate. The solution is also utilized to determined finite width correction factors for fracture energy characterization tests in which neither plane stress nor plane strain conditions apply.

  1. Cantilever clamp fitting

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B. (Inventor)

    1989-01-01

    A device is disclosed for sealing and clamping a cylindrical element which is to be attached to an object such as a wall, a pressurized vessel or another cylindrical element. The device includes a gland having an inner cylindrical wall, which is threaded at one end and is attached at a bendable end to a deformable portion, which in turn is attached to one end of a conical cantilever structure. The other end of the cantilever structure connects at a bendable area to one end of an outer cylindrical wall. The opposite end of cylindrical wall terminates in a thickened portion, the radially outer surface of which is adapted to accommodate a tool for rotating the gland. The terminal end of cylindrical wall also includes an abutment surface, which is adapted to engage a seal, which in turn engages a surface of a receiver. The receiver further includes a threaded portion for engagement with the threaded portion of gland whereby a tightening rotation of gland relative to receiver will cause relative movement between cylindrical walls and of gland. This movement causes a rotation of the conical structure and thus a bending action at bending area and at the bending end of the upper end of inner cylindrical wall. These rotational and bending actions result in a forcing of the deformable portion radially inwardly so as to contact and deform a pipe. This forcible contact creates a seal between gland and pipe, and simultaneously clamps the pipe in position.

  2. Absorption Spectroscopy and Imaging from the Visible through Mid-IR with 20 nm Resolution Using AFM probes

    NASA Astrophysics Data System (ADS)

    Centrone, Andrea

    2015-03-01

    Correlated nanoscale composition and optical property maps are important to engineer nanomaterials in applications ranging from photovoltaics to sensing and therapeutics. Wavelengths (λs) from the visible to near-IR probe electronic transitions in materials, providing information regarding band gap and defects while light in mid-IR probes vibrational transitions and provide chemical composition. However, light diffraction limits the lateral resolution of conventional micro-spectroscopic techniques to approximately λ/2, which is insufficient to image nanomaterials. Additionally, the λ-dependent resolution impedes direct comparison of spectral maps from different spectral ranges. Photo Thermal Induced Resonance (PTIR) is a novel technique that circumvents light diffraction by employing an AFM tip as a local detector for measuring light absorption with λ-independent nanoscale resolution. Our PTIR setup combines an AFM microscope with three lasers providing λ-tunability from 500 nm to 16000 nm continuously. The AFM tip transduces locally the sample thermal expansion induced by light absorption into large cantilever oscillations. Local absorption spectra (electronic or vibrational) and maps are obtained recording the amplitude of the tip deflection as a function of λ and position, respectively. The working principles of the PTIR technique will be described first, and nano-patterned polymer samples will be used to evaluate its lateral resolution, sensitivity and linearity. Results show that the PTIR signal intensity is proportional to the local absorbed energy suggesting applicability of this technique for quantitative chemical analysis at nanoscale, at least for thin (less than 1000 nm thick) samples. Additionally, a λ-independent resolution as high as 20 nm is demonstrated across the whole spectral range. In the second part of the talk, PTIR will be applied to image the dark plasmonic resonance of gold Asymmetric Split Ring Resonators (A-SRRs) in the mid

  3. Probing the Si(001) surface with a Si tip: An ab initio study

    NASA Astrophysics Data System (ADS)

    Kantorovich, Lev; Hobbs, Chris

    2006-06-01

    Topographic noncontact atomic force microscopy (NC-AFM) images of the p(2×1) and c(4×2) reconstructions of the Si(001) surface are simulated for the cases of weak and strong tip-surface interactions and various temperatures using ab initio density functional theory. In the simulations the surface is imaged by a sharp silicon tip with a single dangling bond at its apex. At a very close approach to the surface, the tip flips a surface dimer when positioned close to its lower atom. The energy barriers for an individual flipped surface dimer to regain its initial configuration are calculated to be ˜0.1eV , implying that the surface should be able to “heal” itself at all but extremely low temperatures during one oscillation cycle of the cantilever. Thus, at small enough temperatures, T⩽70K , and large frequency shifts, the imaging process is dominated by tip induced dimer flip events resulting in a permanent deformation of the surface and an apparent p(2×1) symmetric phase to be observed. No dissipation is expected as the tip oscillations are conservative at these conditions. At intermediate temperatures, 70K⩽T⩽200K , the flipped dimers are able to return to the ground state during each tip oscillation, resulting in continuous healing of the surface and thus large dissipation is expected. At T⩾200K dimers flip back and forth easily resulting in an apparent symmetric p(2×1) phase and noticeable dissipation. At small frequency shifts the dimers do not flip, still the upper dimer atoms are imaged as bright so that surface reconstruction can easily be determined. The possibility of manipulating the orientation of dimers at low temperatures and large frequency shifts by means of preprogrammed scan directions, is also discussed.

  4. Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

    DOE PAGESBeta

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

    2016-09-08

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify themore » findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. In conclusion, GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.« less

  5. Cantilever epitaxial process

    DOEpatents

    Ashby, Carol I.; Follstaedt, David M.; Mitchell, Christine C.; Han, Jung

    2003-07-29

    A process of growing a material on a substrate, particularly growing a Group II-VI or Group III-V material, by a vapor-phase growth technique where the growth process eliminates the need for utilization of a mask or removal of the substrate from the reactor at any time during the processing. A nucleation layer is first grown upon which a middle layer is grown to provide surfaces for subsequent lateral cantilever growth. The lateral growth rate is controlled by altering the reactor temperature, pressure, reactant concentrations or reactant flow rates. Semiconductor materials, such as GaN, can be produced with dislocation densities less than 10.sup.7 /cm.sup.2.

  6. An AFM-based surface oxidation process for heavily carbon-doped p-type GaAs with a hole concentration of 1.5×1021 cm-3

    NASA Astrophysics Data System (ADS)

    Shirakashi, J.-I.; Matsumoto, K.; Konagai, M.

    Under appropriate bias conditions in ambient humidity, AFM can be used to selectively oxidize the surface of electronic materials such as metals and semiconductors. Therefore, an AFM-based surface modification technique would be a powerful tool for fabricating nanometer-sized metal (M)/insulator (I) or semiconductor (S)/insulator (I) junction structures. Heavily carbon-doped p-type GaAs with a hole concentration of 1.5×1021 cm-3 is also of great interest for application to novel device structures, because the carrier concentration is comparable to that of normal metals. Selective surface oxidation of carbon-doped p-type GaAs was achieved using a negatively biased conductive tip. The oxidation shown here was carried out under 20-25% ambient humidity. By changing the applied bias voltage and the scanning speed of the cantilever, the size of the modified structure wires was precisely controlled, with a feature size of 10 nm. These results suggest that GaAs-based devices with ultra-small SIS junction systems could be realized using the AFM-based surface oxidation process.

  7. Molecular modeling of enzyme attachment on AFM probes.

    PubMed

    Oliveira, Guedmiller S; Leite, Fabio L; Amarante, Adriano M; Franca, Eduardo F; Cunha, Richard A; Briggs, James M; Freitas, Luiz C G

    2013-09-01

    The immobilization of enzymes on atomic force microscope tip (AFM tip) surface is a crucial step in the development of nanobiosensors to be used in detection process. In this work, an atomistic modeling of the attachment of the acetyl coenzyme A carboxylase (ACC enzyme) on a functionalized AFM tip surface is proposed. Using electrostatic considerations, suitable enzyme-surface orientations with the active sites of the ACC enzyme available for interactions with bulk molecules were found. A 50 ns molecular dynamics trajectory in aqueous solution was obtained and surface contact area, hydrogen bonding and protein stability were analyzed. The enzyme-surface model proposed here with minor adjustment can be applied to study antigen-antibody interactions as well as enzyme immobilization on silica for chromatography applications. PMID:24029365

  8. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers

    NASA Astrophysics Data System (ADS)

    Revilla, Reynier I.

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe–sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10–20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin–ultrathin layers (h < 10–50 nm). Under the same conditions the z–piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD–SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material.

  9. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers.

    PubMed

    Revilla, Reynier I

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe-sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10-20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin-ultrathin layers (h < 10-50 nm). Under the same conditions the z-piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD-SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material. PMID:27199351

  10. Chemical sensor with oscillating cantilevered probe

    DOEpatents

    Adams, Jesse D

    2013-02-05

    The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

  11. Characterizing Cell Mechanics with AFM and Microfluidics

    NASA Astrophysics Data System (ADS)

    Walter, N.; Micoulet, A.; Suresh, S.; Spatz, J. P.

    2007-03-01

    Cell mechanical properties and functionality are mainly determined by the cytoskeleton, besides the cell membrane, the nucleus and the cytosol, and depend on various parameters e.g. surface chemistry and rigidity, surface area and time available for cell spreading, nutrients and drugs provided in the culture medium. Human epithelial pancreatic and mammary cancer cells and their keratin intermediate filaments are the main focus of our work. We use Atomic Force Microscopy (AFM) to study cells adhering to substrates and Microfluidic Channels to probe cells in suspension, respectively. Local and global properties are extracted by varying AFM probe tip size and the available adhesion area for cells. Depth-sensing, instrumented indentation tests with AFM show a clear difference in contact stiffness for cells that are spread of controlled substrates and those that are loosely attached. Microfluidic Channels are utilized in parallel to evaluate cell deformation and ``flow resistance'', which are dependent on channel cross section, flow rate, cell nucleus size and the mechanical properties of cytoskeleton and membrane. The results from the study are used to provide some broad and quantitative assessments of the connections between cellular/subcellular mechanics and biochemical origins of disease states.

  12. Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer.

    PubMed

    Inada, Natsumi; Asakawa, Hitoshi; Kobayashi, Taiki; Fukuma, Takeshi

    2016-01-01

    Photothermal excitation is a cantilever excitation method that enables stable and accurate operation for dynamic-mode AFM measurements. However, the low excitation efficiency of the method has often limited its application in practical studies. In this study, we propose a method for improving the photothermal excitation efficiency by coating cantilever backside surface near its fixed end with colloidal graphite as a photothermal conversion (PTC) layer. The excitation efficiency for a standard cantilever of PPP-NCHAuD with a spring constant of ≈40 N/m and a relatively stiff cantilever of AC55 with a spring constant of ≈140 N/m were improved by 6.1 times and 2.5 times, respectively, by coating with a PTC layer. We experimentally demonstrate high stability of the PTC layer in liquid by AFM imaging of a mica surface with atomic resolution in phosphate buffer saline solution for more than 2 h without any indication of possible contamination from the coating. The proposed method, using a PTC layer made of colloidal graphite, greatly enhances photothermal excitation efficiency even for a relatively stiff cantilever in liquid. PMID:27335733

  13. Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer

    PubMed Central

    Inada, Natsumi; Kobayashi, Taiki; Fukuma, Takeshi

    2016-01-01

    Summary Photothermal excitation is a cantilever excitation method that enables stable and accurate operation for dynamic-mode AFM measurements. However, the low excitation efficiency of the method has often limited its application in practical studies. In this study, we propose a method for improving the photothermal excitation efficiency by coating cantilever backside surface near its fixed end with colloidal graphite as a photothermal conversion (PTC) layer. The excitation efficiency for a standard cantilever of PPP-NCHAuD with a spring constant of ≈40 N/m and a relatively stiff cantilever of AC55 with a spring constant of ≈140 N/m were improved by 6.1 times and 2.5 times, respectively, by coating with a PTC layer. We experimentally demonstrate high stability of the PTC layer in liquid by AFM imaging of a mica surface with atomic resolution in phosphate buffer saline solution for more than 2 h without any indication of possible contamination from the coating. The proposed method, using a PTC layer made of colloidal graphite, greatly enhances photothermal excitation efficiency even for a relatively stiff cantilever in liquid. PMID:27335733

  14. PREFACE: NC-AFM 2006: Proceedings of the 9th International Conference on Non-contact Atomic Force Microscopy

    NASA Astrophysics Data System (ADS)

    Tomitori, Masahiko; Onishi, Hiroshi

    2007-02-01

    The advent of scanning probe microscopy (SPM) in the 1980s has significantly promoted nanoscience and nanotechnology. In particular, non-contact atomic force microscopy (NC-AFM), one of the SPM family, has unique capabilities with high spatial resolution for nanoscale measurements in vacuum, air and liquids. In the last decade we have witnessed the rapid progress of NC-AFM with improved performance and increasing applications. A series of NC-AFM international conferences have greatly contributed to this field. Initiated in Osaka in 1998, the NC-AFM meeting has been followed by annual conferences at Pontresina, Hamburg, Kyoto, Montreal, Dingle, Seattle and Bad Essen. The 9th conference was held in Kobe, Japan, 16-20 July 2006. This special issue of Nanotechnology contains the outstanding contributions of the conference. During the meeting delegates learnt about a number of significant advances. Topics covered atomic resolution imaging of metals, semiconductors, insulators, ionic crystals, oxides, molecular systems, imaging of biological materials in various environments and novel instrumentation. Work also included the characterization of electronic and magnetic properties, tip and cantilever fabrication and characterization, atomic distinction based on analysis of tip-sample interaction, atomic scale manipulation, fabrication of nanostructures using NC-AFM, and related theories and simulations. We are greatly impressed by the increasing number of applications, and convinced that NC-AFM and related techniques are building a bridge to a future nano world, where quantum phenomena will dominate and nano devices will be realized. In addition, a special session on SPM road maps was held as a first trial in the field, where the future prospects of SPM were discussed enthusiastically. The overall success of the NC-AFM 2006 conference was due to the efforts of many individuals and groups with respect to scientific and technological progress, as well as the international

  15. High throughout reproducible cantilever functionalization

    DOEpatents

    Evans, Barbara R; Lee, Ida

    2014-11-25

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  16. High throughput reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-01-21

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  17. AFM investigation of Martian soil simulants on micromachined Si substrates.

    PubMed

    Vijendran, S; Sykulska, H; Pike, W T

    2007-09-01

    The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range have been studied using a combination of optical and atomic force microscopy (AFM) in preparation for the 2007 NASA Phoenix Mars Lander mission. The operation of an atomic force microscope on samples of micrometre-sized soil particles is a poorly investigated area where the unwanted interaction between the scanning tip and loose particles results in poor image quality and tip contamination by the sample. In order to mitigate these effects, etched silicon substrates with a variety of features have been used to facilitate the sorting and gripping of particles. From these experiments, a number of patterns were identified that were particularly good at isolating and immobilizing particles for AFM imaging. This data was used to guide the design of micromachined substrates for the Phoenix AFM. Both individual particles as well as aggregates were successfully imaged, and information on sizes, shapes and surface morphologies were obtained. This study highlights both the strengths and weaknesses of AFM for the potential in situ investigation of Martian soil and dust. Also presented are more general findings of the limiting operational constraints that exist when attempting the AFM of high aspect ratio particles with current technology. The performance of the final designs of the substrates incorporated on Phoenix will be described in a later paper. PMID:17760618

  18. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever

    NASA Astrophysics Data System (ADS)

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid.

  19. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever.

    PubMed

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid. PMID:23848696

  20. Assessment of insulated conductive cantilevers for biology and electrochemistry

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Gullo, Maurizio R.; Akiyama, Terunobu; Tonin, Andreas; de Rooij, Nicolaas F.; Staufer, Urs; Engel, Andreas

    2005-08-01

    This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <=0.1 N m-1 and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than 1 pA in faradaic current with a lateral resolution of 7.8 nm.

  1. Batch-fabrication of cantilevered magnets on attonewton-sensitivity mechanical oscillators for scanned-probe nanoscale magnetic resonance imaging

    PubMed Central

    Hickman, Steven A.; Moore, Eric W.; Lee, SangGap; Longenecker, Jonilyn G.; Wright, Sarah J.; Harrell, Lee E.; Marohn, John A.

    2015-01-01

    We have batch-fabricated cantilevers with ~100 nm diameter nickel nanorod tips and force sensitivities of a few attonewtons at 4.2 kelvin. The magnetic nanorods were engineered to overhang the leading edge of the cantilever and, consequently, the cantilevers experience what we believe is the lowest surface noise ever achieved in a scanned probe experiment. Cantilever magnetometry indicated that the tips were well magnetized, with a ≤ 20 nm dead layer; the composition of the dead layer was studied by electron microscopy and electron energy loss spectroscopy. In what we believe is the first demonstration of scanned probe detection of electron-spin resonance from a batch fabricated tip, the cantilevers were used to observe electron-spin resonance from nitroxide spin labels in a film via force-gradient-induced shifts in cantilever resonance frequency. The magnetic field dependence of the magnetic resonance signal suggests a non-uniform tip magnetization at an applied field near 0.6 T. PMID:21082863

  2. In situ cell detection using piezoelectric lead zirconate titanate-stainless steel cantilevers

    NASA Astrophysics Data System (ADS)

    Yi, Jeong W.; Shih, Wan Y.; Mutharasan, R.; Shih, Wei-Heng

    2003-01-01

    We have investigated piezoelectric lead zirconate titanate (PZT)-stainless steel cantilevers as real-time in-water cell detectors using yeast cells as a model system. Earlier studies have shown that mass changes of a cantilever can be detected by monitoring the resonance frequency shift. In this study, two PZT-stainless steel cantilevers with different sensitivities were used to detect the presence of yeast cells in a suspension. The stainless steel cantilever tip was coated with poly-L-lysine that attracted yeast cells from the suspension, and immobilized them on the cantilever surface. After immersing the poly-L-lysine coated tip in a yeast suspension, the flexural resonance frequency of the cantilever was monitored with time. The flexural resonance frequency decreased with time in agreement with the optical micrographs that showed increasing amount of adsorbed yeast cells with time. The resonance frequency shifts are further shown to be consistent with both the mass of immobilized cells on the poly-L-lysine coated stainless steel surface and that deduced from the optical micrographs. Furthermore, under the present experimental conditions where the cell diffusion distance is smaller than the linear dimension of the adsorption area, it is shown that the rate of resonance frequency shift is linear with the cell concentration and the rate of resonance frequency shift can be used to quantify the cell concentration.

  3. A micro-SPM head array with exchangeable cantilevers

    NASA Astrophysics Data System (ADS)

    Gao, S.; Wolff, H.; Herrmann, K.; Brand, U.; Hiller, K.; Hahn, S.; Sorger, A.; Mehner, J.

    2012-04-01

    In this paper a MEMS based micro-SPM head array is proposed to enhance the performance of the currently available nano-measuring machines and effectively reduce the measurement time for large specimen. It consists of 1 × N ( N = 7 in our case) micro-SPM heads/units, realized in one chip by MEMS technique. And it can be easily extended to a micro- SPM head matrix. The main part of the micro-SPM head is the MEMS-positioning stage, which is realized on the basis of an electrostatic lateral comb-drive actuator. In order to take the advantage of the high lateral resolution of conventional cantilevers, a flexible cantilever gripper was designed to be integrated into the MEMS-positioning stage within the SPM head. Conventional cantilevers can be mechanically mounted onto the MEMS-positioning stage or dismantled from the MEMS-positioning stage after the tip is worn out. In this way, the well-designed and calibrated MEMS-positioning stage can be repeatedly and efficiently utilized. The structure design and simulation of mechanical and electrical performances of the mico-SPM head will be detailed in this paper. First experimental results proved the feasibility of the cantilever gripper design.

  4. CO tip functionalization in subatomic resolution atomic force microscopy

    SciTech Connect

    Kim, Minjung; Chelikowsky, James R.

    2015-10-19

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule.

  5. Improving picogram mass sensitivity via frequency doubling in coupled silicon micro-cantilevers

    NASA Astrophysics Data System (ADS)

    Wang, Dong F.; Du, Xu; Wang, Xin; Ikehara, Tsuyoshi; Maeda, Ryutaro

    2016-01-01

    Two geometrically different cantilevers, with primary frequencies of 182.506 kHz (u-shaped cantilever for sensing) and 372.503 kHz (rectangular cantilever for detecting), were coupled by two symmetrical coupling overhangs for oscillation-based mass sensing verification with phase-locking. Based on a lumped element model, a theoretical expression, containing a nonlinear spring constant and a term corresponding to the effect of the coupling spring, was proposed to consider the factors influencing the entrainment range, which is defined as a plateau with a frequency ratio (resonant frequency of rectangular cantilever to that of u-shaped cantilever) of 2.000 in present study. A picogram order mass sensing by applying a polystyrene microsphere as a small mass perturbation onto the tip of the u-shaped cantilever was demonstrated. By varying driving voltages, two entrainment regions with and without microsphere were experimentally measured and comparatively shown. At a driving voltage of 1 Vpp, when the u-shaped cantilever was excited at its shifted frequency of 180.29 kHz, the frequency response of the coupled rectangular cantilever had a peak at double the shifted frequency of 360.58 kHz of the u-shaped cantilever. The frequency shift for picogram mass sensing was thus doubled from 2560 Hz to 5133 Hz due to phase-locking. A mass of 3.732 picogram was derived based on the doubled frequency shift corresponding to a calculated mass of 3.771 picogram from measured diameter and reported density. Both experimental demonstration and theoretical discussions from the viewpoint of entrainment range elicits the possibility of increasing the mass sensitivity via phase-locking in the coupled silicon micro-cantilevers.

  6. Hydrodynamic effects in fast AFM single-molecule force measurements.

    PubMed

    Janovjak, Harald; Struckmeier, Jens; Müller, Daniel J

    2005-02-01

    Atomic force microscopy (AFM) allows the critical forces that unfold single proteins and rupture individual receptor-ligand bonds to be measured. To derive the shape of the energy landscape, the dynamic strength of the system is probed at different force loading rates. This is usually achieved by varying the pulling speed between a few nm/s and a few microm/s, although for a more complete investigation of the kinetic properties higher speeds are desirable. Above 10 microm/s, the hydrodynamic drag force acting on the AFM cantilever reaches the same order of magnitude as the molecular forces. This has limited the maximum pulling speed in AFM single-molecule force spectroscopy experiments. Here, we present an approach for considering these hydrodynamic effects, thereby allowing a correct evaluation of AFM force measurements recorded over an extended range of pulling speeds (and thus loading rates). To support and illustrate our theoretical considerations, we experimentally evaluated the mechanical unfolding of a multi-domain protein recorded at 30 microm/s pulling speed. PMID:15257425

  7. Micromachined Silicon Cantilever Magnetometry.

    NASA Astrophysics Data System (ADS)

    Chaparala, M. V.

    1998-03-01

    Magnetic torque measurements give us a simple and attractive method for characterizing the anisotropic properties of magnetic materials. Silicon torque and force magnetometers have many advantages over traditional torsion fiber torque magnetometers. We have fabricated micromachined silicon torque and force magnetometers employing both capacitive(``Capacitance platform magnetometer for thin film and small crystal superconductor studies'', M. Chaparala et al.), AIP Conf. Proc. (USA), AIP Conference Proceedings, no.273, p. 407 1993. and strain dependent FET detection(``Strain Dependent Characterstics of Silicon MOSFETs and their Applications'', M. Chaparala et al.), ISDRS Conf. Proc. 1997. schemes which realize some of these gains. We will present the pros and cons of each of the different detection schemes and the associated design constraints. We have developed a feedback scheme which enables null detection thus preserving the integrity of the sample orientation. We will present a method of separating out the torque and force terms in the measured signals and will discuss the errors associated with each of the designs. Finally, we present the static magnetic torque measurements on various materials with these devices, including equilibrium properties on sub microgram specimens of superconductors, and dHvA measurements near H_c2. We will also discuss their usefulness in pulsed magnetic fields(``Cantilever magnetometry in pulsed magnetic fields", M. J. Naughton et al.), Rev. of Sci. Instrum., vol.68, p. 4061 1997..

  8. Influence of spurious resonances on the interaction force in dynamic AFM.

    PubMed

    Costa, Luca; Rodrigues, Mario S

    2015-01-01

    The quantification of the tip-sample interaction in amplitude modulation atomic force microscopy is challenging, especially when measuring in liquid media. Here, we derive formulas for the tip-sample interactions and investigate the effect of spurious resonances on the measured interaction. Highlighting the differences between measuring directly the tip position or the cantilever deflection, and considering both direct and acoustic excitation, we show that the cantilever behavior is insensitive to spurious resonances as long as the measured signal corresponds to the tip position, or if the excitation force is correctly considered. Since the effective excitation force may depend on the presence of such spurious resonances, only the case in which the frequency is kept constant during the measurement is considered. Finally, we show the advantages that result from the use of a calibration method based on the acquisition of approach-retract curves. PMID:25821682

  9. Gold nanoparticle tips for optical field confinement in infrared scattering near-field optical microscopy.

    PubMed

    Wenzel, Marc Tobias; Härtling, Thomas; Olk, Phillip; Kehr, Susanne C; Grafström, Stefan; Winnerl, Stephan; Helm, Manfred; Eng, Lukas M

    2008-08-01

    We report on the implementation of metal nanoparticles as probes for scattering and apertureless near-field optical investigations in the mid-infrared (mid-IR) spectral regime. At these wavelengths, an efficient electric-field confinement is necessary and achieved here through a gold metal nanoparticle of 80 nm in diameter (Au80-MNP) acting as the optical antenna. The Au80-MNP is attached to a standard AFM cantilever used as the spatial manipulator. When approached to a sample surface while being illuminated with an infrared beam, the Au80-MNP produces a considerably improved spatial confinement of the electric field compared to an ordinary scattering AFM tip. We demonstrate here the confinement normal to the sample surface by making use of a sample-induced phonon polariton resonance in a ferroelectric lithium niobate sample. Our experimental findings are in very good agreement with the quasistatic dipole model and show improved optical resolution via well-selected antenna particles. PMID:18679508

  10. The importance of correcting for variable probe-sample interactions in AFM-IR spectroscopy: AFM-IR of dried bacteria on a polyurethane film.

    PubMed

    Barlow, Daniel E; Biffinger, Justin C; Cockrell-Zugell, Allison L; Lo, Michael; Kjoller, Kevin; Cook, Debra; Lee, Woo Kyung; Pehrsson, Pehr E; Crookes-Goodson, Wendy J; Hung, Chia-Suei; Nadeau, Lloyd J; Russell, John N

    2016-08-01

    AFM-IR is a combined atomic force microscopy-infrared spectroscopy method that shows promise for nanoscale chemical characterization of biological-materials interactions. In an effort to apply this method to quantitatively probe mechanisms of microbiologically induced polyurethane degradation, we have investigated monolayer clusters of ∼200 nm thick Pseudomonas protegens Pf-5 bacteria (Pf) on a 300 nm thick polyether-polyurethane (PU) film. Here, the impact of the different biological and polymer mechanical properties on the thermomechanical AFM-IR detection mechanism was first assessed without the additional complication of polymer degradation. AFM-IR spectra of Pf and PU were compared with FTIR and showed good agreement. Local AFM-IR spectra of Pf on PU (Pf-PU) exhibited bands from both constituents, showing that AFM-IR is sensitive to chemical composition both at and below the surface. One distinct difference in local AFM-IR spectra on Pf-PU was an anomalous ∼4× increase in IR peak intensities for the probe in contact with Pf versus PU. This was attributed to differences in probe-sample interactions. In particular, significantly higher cantilever damping was observed for probe contact with PU, with a ∼10× smaller Q factor. AFM-IR chemical mapping at single wavelengths was also affected. We demonstrate ratioing of mapping data for chemical analysis as a simple method to cancel the extreme effects of the variable probe-sample interactions. PMID:27403761

  11. Characterizing atomic force microscopy tip shape in use.

    PubMed

    Wang, Chunmei; Itoh, Hiroshi; Sun, Jielin; Hu, Jun; Shen, Dianhong; Ichimura, Shingo

    2009-02-01

    A new tip characterizer based on the fabrication of multilayer thin films for atomic force microscopy (AFM) was developed to analyze the effective tip shape while in use. The precise structure of this tip characterizer was measured by transmission electron microscopy. Four different types of commercial tips with various radii were characterized by the tip characterizer and by conventional scanning electron microscopy (SEM). The results were compared to obtain a relationship between the actual and effective tip shapes. A quantitative analysis was performed of apex radii measured from line profiles of comb-shaped patterns and nanometer-scale knife-edges without the problem of edge uncertainty in the SEM image. Degradation of the AFM tip induced by electron-beam irradiation was studied by using SEM and the tip characterizer. A potential technique for fabricating symmetric AFM tips based on irradiation by an electron beam and a quantitative analysis of changing the tip apex in SEM were examined with AFM using the tip characterizer. PMID:19441396

  12. Simple, clickable protocol for atomic force microscopy tip modification and its application for trace ricin detection by recognition imaging

    Technology Transfer Automated Retrieval System (TEKTRAN)

    There are three standard steps for AFM tip functionalization in a single molecule recognition force microscope (SMRFM). First, AFM tip is modified to carry a specific chemical function group; second, the cross-linker PEG is attached to the tip; finally, the modified biological molecule is connected ...

  13. Simple, Clickable Protocol for Atomic Force Microscopy Tip Modification and Its Application for Trace Ricin Detection by Recognition Imaging

    Technology Transfer Automated Retrieval System (TEKTRAN)

    There are three standard steps for AFM tip functionalization in a single molecule recognition force microscope (SMRFM). First, AFM tip was modified to carry a specific chemical function group; second, the cross-linker PEG was attached to the tip; finally, the modified biological molecule was connect...

  14. Calibration Technique Using Nonlinear Region in Cantilever Magnetometry Experiments and Presence of Universal Curve

    NASA Astrophysics Data System (ADS)

    Torizuka, Kiyoshi; Tajima, Hiroyuki; Yoshida, Gosuke; Inoue, Munenori

    2013-06-01

    We have presented a calibration technique for commercially available atomic force microscopy (AFM) cantilevers used in torque magnetometry experiments. The absolute values (J/rad) of the torque can be derived against the output signal, which is the change in piezoresistivity due to the deflection of the cantilever beam. The calibration has been performed using the susceptibility of a graphite plane. The linearity between the output signal and the torque is confirmed up to +/-1×10-8 J/rad of the torque. More importantly, since the nonlinear response of the cantilever is reproducible, we have also utilized the nonlinear region, so that the calibration range has been pushed up to +/-4 ×10-8 J/rad. In the nonlinear range, an important finding is that any curve (torque vs output signal curve) that is cantilever-dependent reduces to a single universal curve, after multiplying an appropriate factor. This factor is cantilever-dependent, but can be derived by rotating the sample-mounted cantilever in a zero magnetic field. We have also proposed a simple model regarding the presence of this universal curve.

  15. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading

    SciTech Connect

    Kennedy, Scott J.; Cole, Daniel G.; Clark, Robert L.

    2009-12-15

    This work presents a method for force calibration of rectangular atomic force microscopy (AFM) microcantilevers under heavy fluid loading. Theoretical modeling of the thermal response of microcantilevers is discussed including a fluid-structure interaction model of the cantilever-fluid system that incorporates the results of the fluctuation-dissipation theorem. This model is curve fit to the measured thermal response of a cantilever in de-ionized water and a cost function is used to quantify the difference between the theoretical model and measured data. The curve fit is performed in a way that restricts the search space to parameters that reflect heavy fluid loading conditions. The resulting fitting parameters are used to calibrate the cantilever. For comparison, cantilevers are calibrated using Sader's method in air and the thermal noise method in both air and water. For a set of eight cantilevers ranging in stiffness from 0.050 to 5.8 N/m, the maximum difference between Sader's calibration performed in air and the new method performed in water was 9.4%. A set of three cantilevers that violate the aspect ratio assumption associated with the fluid loading model (length-to-width ratios less than 3.5) ranged in stiffness from 0.85 to 4.7 N/m and yielded differences as high as 17.8%.

  16. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans.

    PubMed

    Meier, Tobias; Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm(3) is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  17. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    PubMed Central

    Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    Summary We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  18. A pressure gauge based on gas density measurement from analysis of the thermal noise of an atomic force microscope cantilever

    SciTech Connect

    Seo, Dongjin; Ducker, William A.; Paul, Mark R.

    2012-05-15

    We describe a gas-density gauge based on the analysis of the thermally-driven fluctuations of an atomic force microscope (AFM) cantilever. The fluctuations are modeled as a ring-down of a simple harmonic oscillator, which allows fitting of the resonance frequency and damping of the cantilever, which in turn yields the gas density. The pressure is obtained from the density using the known equation of state. In the range 10-220 kPa, the pressure readings from the cantilever gauge deviate by an average of only about 5% from pressure readings on a commercial gauge. The theoretical description we use to determine the pressure from the cantilever motion is based upon the continuum hypothesis, which sets a minimum pressure for our analysis. It is anticipated that the cantilever gauge could be extended to measure lower pressures given a molecular theoretical description. Alternatively, the gauge could be calibrated for use in the non-continuum range. Our measurement technique is similar to previous AFM cantilever measurements, but the analysis produces improved accuracy.

  19. Soft-materials elastic and shear moduli measurement using piezoelectric cantilevers

    NASA Astrophysics Data System (ADS)

    Markidou, Anna; Shih, Wan Y.; Shih, Wei-Heng

    2005-06-01

    We have developed a soft-material elastic modulus and shear modulus sensor using piezoelectric cantilevers. A piezoelectric cantilever is consisted of a highly piezoelectric layer, e.g., lead-zirconate-titanate bonded to a nonpiezoelectric layer, e.g., stainless steel. Applying an electric field in the thickness direction causes a piezoelectric cantilever to bend, generating an axial displacement or force. When a piezoelectric cantilever is in contact with an object, this electric field-generated axial displacement is reduced due to the resistance by the object. With a proper design of the piezoelectric cantilever's geometry, its axial displacements with and without contacting the object could be accurately measured. From these measurements the elastic modulus of the object can be deduced. In this study, we tailored the piezoelectric cantilevers for measuring the elastic and shear moduli of tissue-like soft materials with forces in the submilli Newton to milliNewton range. Elastic moduli and shear moduli of soft materials were measured using piezoelectric cantilevers with a straight tip and an L-shaped tip, respectively. Using gelatin and commercial rubber material as model soft tissues, we showed that a piezoelectric cantilever 1.5-2cm long could measure the elastic modulus and the shear modulus of a small soft material sample (1-3mm wide) in the small strain range (<1%). For samples 5mm high, the resultant compressive (shear) strains were less than 0.5% (1%). The measurements were validated by (1) comparing the measured Young's modulus of the commercial rubber sample with its known value and (2) by measuring both the Young's modulus and shear modulus on the samples and confirming the thus deduced Poisson's ratios with the separately measured Poisson's ratios.

  20. Multidomain piezo-ceramic cantilever

    NASA Astrophysics Data System (ADS)

    Sedorook, David P.

    PZT-5H is a ferroelectric and piezoelectric material that has many applications that are the subjects of current research. As a ferroelectric, PZT-5H has a permanent electrical polarization that arises from ferroelectric domains. In this thesis, numerical simulations were conducted via the well know Finite Element Method of several types of piezoelectric cantilevers that were made of PIC-181, a high quality PZT-5H made in Germany. Single crystal cantilever models with multiple polarization vectors were investigated with Q factors ranging from Q = 50 to Q = 1200, where the acoustical displacements were calculated. Further, the displacements were calculated for a multidomain cantilever model with inversely poled domains and uniform electrode configuration as well as a single crystal cantilever model with uniformly poled crystal and bipolar electrode configuration. It was shown that cantilevers that are less oblong in shape could benefit from the bipolar electrode configuration in applications where size may be an important parameter, for instance in small flying robotic insects. From the experimental measurements of the resonance and anti-resonance frequencies in various PIC-181 samples, the radial and longitudinal components of speed of sound in material were calculated. Experimental results of longitudinal speed of sound differed from the accepted value of 4.6 km/s by 1.6 % error.

  1. Solvent-mediated repair and patterning of surfaces by AFM

    SciTech Connect

    Elhadj, S; Chernov, A; De Yoreo, J

    2007-10-30

    A tip-based approach to shaping surfaces of soluble materials with nanometer-scale control is reported. The proposed method can be used, for example, to eliminate defects and inhomogeneities in surface shape, repair mechanical or laser-induced damage to surfaces, or perform 3D lithography on the length scale of an AFM tip. The phenomenon that enables smoothing and repair of surfaces is based on the transport of material from regions of high- to low-curvature within the solution meniscus formed in a solvent-containing atmosphere between the surface in question and an AFM tip scanned over the surface. Using in situ AFM measurements of the kinetics of surface remodeling on KDP (KH{sub 2}PO{sub 4}) crystals in humid air, we show that redistribution of solute material during relaxation of grooves and mounds is driven by a reduction in surface free energy as described by the Gibbs-Thomson law. We find that the perturbation from a flat interface evolves according to the diffusion equation where the effective diffusivity is determined by the product of the surface stiffness and the step kinetic coefficient. We also show that, surprisingly, if the tip is instead scanned over or kept stationary above an atomically flat area of the surface, a convex structure is formed with a diameter that is controlled by the dimensions of the meniscus, indicating that the presence of the tip and meniscus reduces the substrate chemical potential beneath that of the free surface. This allows one to create nanometer-scale 3D structures of arbitrary shape without the removal of substrate material or the use of extrinsic masks or chemical compounds. Potential applications of these tip-based phenomena are discussed.

  2. Vortex-Induced Vibration of a Flexible Cantilever

    NASA Astrophysics Data System (ADS)

    Fujarra, A. L. C.; Pesce, C. P.; Flemming, F.; Williamson, C. H. K.

    2001-04-01

    This study is concerned with the vortex-induced vibrations of a flexible cantilever in a fluid flow. Our cantilever comprises a leaf spring encased within a rubber flexible cylinder, restricting the vibrations of the body in a water channel flow to principally transverse motion. It is found that the transverse amplitude response of the cantilever has a marked similarity with transverse vibrations of an elastically mounted rigid cylinder, in that there is a clear initial branch extending to high amplitudes, with a jump to a lower branch response, as normalized velocity is increased. The continuous initial branch suggests that a distinct upper branch does not exist for the cantilever, as is found for a rigid cylinder under similar conditions of low mass and damping. Good agreement is found between the response amplitude and frequency for two identical cantilevers, one set up by Pesce and Fujarra, where strain is measured to infer the body dynamics, and the other arrangement by Flemming and Williamson, where the tip motion is measured using optical techniques. An interesting large-amplitude response mode is found at higher normalized velocities (U*>12) outside the principal synchronization regime (typically U*=4-8), which is observed for an increasing velocity, or may be triggered by manual streamwise disturbances of the body. This vibration mode is due to a coupled streamwise-transverse motion, where the streamwise amplitude becomes non-negligible, and may be related to a further vibration mode at high normalized speed, found for a vibrating pivoted rod, by Kitagawa et al. (1999).

  3. Force-controlled manipulation of single cells: from AFM to FluidFM.

    PubMed

    Guillaume-Gentil, Orane; Potthoff, Eva; Ossola, Dario; Franz, Clemens M; Zambelli, Tomaso; Vorholt, Julia A

    2014-07-01

    The ability to perturb individual cells and to obtain information at the single-cell level is of central importance for addressing numerous biological questions. Atomic force microscopy (AFM) offers great potential for this prospering field. Traditionally used as an imaging tool, more recent developments have extended the variety of cell-manipulation protocols. Fluidic force microscopy (FluidFM) combines AFM with microfluidics via microchanneled cantilevers with nano-sized apertures. The crucial element of the technology is the connection of the hollow cantilevers to a pressure controller, allowing their operation in liquid as force-controlled nanopipettes under optical control. Proof-of-concept studies demonstrated a broad spectrum of single-cell applications including isolation, deposition, adhesion and injection in a range of biological systems. PMID:24856959

  4. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    SciTech Connect

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-15

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm/{radical}(Hz) by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  5. Surface Morphological Studies on Nerve Cells by AFM

    NASA Astrophysics Data System (ADS)

    Durkaya, Goksel; Zhong, Lei; Rehder, Vincent; Dietz, Nikolaus

    2009-03-01

    Surface morphological properties of fixed and living nerve cells removed from the buccal ganglion of Helisoma trivolvis have been studied by using Atomic Force Microscopy (AFM). Identified, individual neurons were removed from the buccal ganglion of Helisoma trivolvis and plated into poly-L-lysine coated glass cover-slips. The growth of the nerve cells was stopped and fixed with 0.1% Glutaraldehyde and 4% Formaldehyde solution after extension of growth cones at the tip of the axons. Topography and softness of growth cone filopodia and overlying lamellopodium (veil) were probed by AFM. Information obtained from AFM's amplitude and phase channels have been used for determination of softness of the region probed. The results of structural studies on the cells are linked to their mechanical properties and internal molecular density distribution.

  6. Effect of AFM probe geometry on visco-hyperelastic characterization of soft materials.

    PubMed

    Boccaccio, Antonio; Lamberti, Luciano; Papi, Massimiliano; De Spirito, Marco; Pappalettere, Carmine

    2015-08-14

    Atomic force microscopy (AFM) nanoindentation is very suited for nano- and microscale mechanical characterization of soft materials. Although the structural response of polymeric networks that form soft matter depends on viscous effects caused by the relative slippage of polymeric chains, the usual assumption made in the AFM-based characterization is that the specimen behaves as a purely elastic material and viscous forces are negligible. However, for each geometric configuration of the AFM tip, there will be a limit indentation rate above which viscous effects must be taken into account to correctly determine mechanical properties. A parametric finite element study conducted on 12 geometric configurations of a blunt cone AFM tip (overall, the study included about 200 finite element analyses) allowed us to determine the limit indentation rate for each configuration. The selected tip dimensions cover commercially available products and account for changes in tip geometry caused by serial measurements. Nanoindentation rates cover typical experimental conditions set in AFM bio-measurements on soft matter. Viscous effects appear to be more significant in the case of sharper tips. This implies that, if quantitative data on sample viscosity are not available, using a rounded indenter and carrying out experiments below the limit indentation rate will allow errors in the determination of mechanical properties to be minimized. PMID:26201503

  7. Dual-Cantilever-Beam Accelerometer

    NASA Technical Reports Server (NTRS)

    Reynolds, Emmitt A.; Speckhart, Frank H.

    1988-01-01

    Sensitivity to velocity changes along beam axis reduced. Weighted-end cantilever beams of accelerometer deflected equally by acceleration in y direction. When acceleration to right as well as up or down, right beam deflected more, while left beam deflected less. Bridge circuit averages outputs of strain gauges measuring deflections, so cross-axis sensitivity of accelerometer reduced. New device simple and inexpensive.

  8. High sensitivity resonance frequency measurements of individualmicro-cantilevers using fiber optical interferometry

    SciTech Connect

    Duden, Thomas; Radmilovic, Velimir

    2009-03-04

    We describe a setup for the resonance frequency measurement of individual microcantilevers. The setup displays both high spatial selectivity and sensitivity to specimen vibrations by utilizing a tapered uncoated fiber tip. The high sensitivity to specimen vibrations is achieved by the combination of optical Fabry-Perot interferometry and narrow band RF detection. Wave fronts reflected on the specimen and on the fiber tip end face interfere, thus no reference plane on the specimen is needed, as demonstrated with the example of freestanding silicon nitride micro-cantilevers. The resulting system is integrated in a DB-235 dual beam FIB system, thereby allowing the measurement of micro-cantilever responses during observation in SEM mode. The FIB was used to modify the optical fiber tip. At this point of our RF system development, the microcantilevers used to characterize the detector were not modified in situ.

  9. Cantilevered probe detector with piezoelectric element

    SciTech Connect

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  10. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  11. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2012-07-10

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  12. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  13. Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM.

    PubMed

    Avdic, A; Lugstein, A; Wu, M; Gollas, B; Pobelov, I; Wandlowski, T; Leonhardt, K; Denuault, G; Bertagnolli, E

    2011-04-01

    We demonstrate a reliable microfabrication process for a combined atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) measurement tool. Integrated cone-shaped sensors with boron doped diamond (BDD) or gold (Au) electrodes were fabricated from commercially available AFM probes. The sensor formation process is based on mature semiconductor processing techniques, including focused ion beam (FIB) machining, and highly selective reactive ion etching (RIE). The fabrication approach preserves the geometry of the original AFM tips resulting in well reproducible nanoscaled sensors. The feasibility and functionality of the fully featured tips are demonstrated by cyclic voltammetry, showing good agreement between the measured and calculated currents of the cone-shaped AFM-SECM electrodes. PMID:21368355

  14. Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM

    NASA Astrophysics Data System (ADS)

    Avdic, A.; Lugstein, A.; Wu, M.; Gollas, B.; Pobelov, I.; Wandlowski, T.; Leonhardt, K.; Denuault, G.; Bertagnolli, E.

    2011-04-01

    We demonstrate a reliable microfabrication process for a combined atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) measurement tool. Integrated cone-shaped sensors with boron doped diamond (BDD) or gold (Au) electrodes were fabricated from commercially available AFM probes. The sensor formation process is based on mature semiconductor processing techniques, including focused ion beam (FIB) machining, and highly selective reactive ion etching (RIE). The fabrication approach preserves the geometry of the original AFM tips resulting in well reproducible nanoscaled sensors. The feasibility and functionality of the fully featured tips are demonstrated by cyclic voltammetry, showing good agreement between the measured and calculated currents of the cone-shaped AFM-SECM electrodes.

  15. Ultrasensitive magnetometry and magnetic resonance imaging using cantilever detection

    NASA Astrophysics Data System (ADS)

    Rugar, Daniel

    2009-03-01

    Micromachined cantilevers make remarkable magnetometers for nanoscale measurements of magnetic materials and for magnetic resonance imaging (MRI). We present various applications of cantilever magnetometry at low temperature using cantilevers capable of attonewton force sensitivity. Small, unexpected magnetic effects can be seen, such as anomalous damping in magnetic field. A key application is magnetic resonance force microscopy (MRFM) of both electron and nuclear spins. In recent experiments with MRFM-based NMR imaging, 3D spatial resolution better than 10 nm was achieved for protons in individual virus particles. The achieved volumetric resolution represents an improvement of 100 million compared to the best conventional MRI. The microscope is sensitive enough to detect NMR signals from adsorbed layers of hydrocarbon contamination, hydrogen in multiwall carbon nanotubes and the phosphorus in DNA. Operating with a force noise on the order of 6 aN per root hertz with a magnetic tip that produces a field gradient in excess of 30 gauss per nanometer, the magnetic moment sensitivity is ˜0.2 Bohr magnetons. The corresponding field sensitivity is ˜3 nT per root hertz. To our knowledge, this combination of high field sensitivity and nanometer spatial resolution is unsurpassed by any other form of nanometer-scale magnetometry.

  16. Technology Tips

    ERIC Educational Resources Information Center

    Mathematics Teacher, 2004

    2004-01-01

    Some inexpensive or free ways that enable to capture and use images in work are mentioned. The first tip demonstrates the methods of using some of the built-in capabilities of the Macintosh and Windows-based PC operating systems, and the second tip describes methods to capture and create images using SnagIt.

  17. Large Deflection of Ideal Pseudo-Elastic Shape Memory Alloy Cantilever Beam

    NASA Astrophysics Data System (ADS)

    Cui, Shitang; Hu, Liming; Yan, Jun

    This paper deals with the large deflections of pseudo-elastic shape memory alloy cantilever beams subjected to a concentrated load at the free end. Because of the large deflections, geometry nonlinearity arises and this analysis employs the nonlinear bending theory. The exact expression of curvature is used in the moment-curvature relationship. As a vertical force at the tip of cantilever, curvature and bending moment distribution expressions are deduced. The curvature changed distinctly when the surface material undergoes phase transformation. The length of phase transformation region was affected greatly with the force at the free end.

  18. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-01

    contact angle. All but one of the eight measurements agreed to within 13%. The constant diameter of the nanoneedle also is used to relate viscous damping of the vibrating cantilever to a macroscopic model of Stokes drag on a long cylinder. Expected increases in drag force with insertion depth and viscosity are observed for several glycerol-water solutions. However, an additional damping term (associated with drag of the meniscus on the sidewalls of the nanoneedle) limits the sensitivity of the measurement of drag force for low-viscosity solutions, while low values of Q limit the sensitivity for high-viscosity solutions. Overall, reasonable correspondence is found between the macroscopic models and the measurements with the nanoneedle-tipped probes. Tighter environmental control of the AFM and treatments of needles to give them more ideal surfaces are expected to improve repeatability and make more evident subtle features that currently appear to be present on the F-D and Q damping curves. PMID:18986184

  19. Sharp Tips on the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

    The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  20. The stress intensity factor for the double cantilever beam

    NASA Technical Reports Server (NTRS)

    Fichter, W. B.

    1983-01-01

    Fourier transforms and the Wiener-Hopf technique are used in conjunction with plane elastostatics to examine the singular crack tip stress field in the double cantilever beam (DCB) specimen. In place of the Dirac delta function, a family of functions which duplicates the important features of the concentrated forces without introducing unmanageable mathematical complexities is used as a loading function. With terms of order h-squared/a-squared retained in the series expansion, the dimensionless stress intensity factor is found to be K (h to the 1/2)/P = 12 to the 1/2 (a/h + 0.6728 + 0.0377 h-squared/a-squared), in which P is the magnitude of the concentrated forces per unit thickness, a is the distance from the crack tip to the points of load application, and h is the height of each cantilever beam. The result is similar to that obtained by Gross and Srawley by fitting a line to discrete results from their boundary collocation analysis.

  1. Massively Multiplexed Cantilever-free Scanning Probe Lithography

    NASA Astrophysics Data System (ADS)

    Brown, Keith A.; Eichelsdoerfer, Daniel J.; Shim, Wooyoung; Boya, Radha; Schmucker, Abrin L.; Liu, Guoliang; Mirkin, Chad A.

    2013-03-01

    Cantilever-free scanning probe lithography has emerged as a low-cost technique for rapidly patterning nanoscale materials. In this architecture, an array of probes is fabricated on a soft backing layer that provides mechanical compliance to each probe while an underlying hard surface maintains the structural integrity of the array. One drawback of this technique is that each probe in the array acts simultaneously and thus generates a copy of the same pattern. Here, we discuss recent efforts to incorporate heaters into these probe arrays so that when a given heater is activated, the thermal expansion of the elastomer actuates a single tip. We find thermal actuation to be powerful enough to actuate individual tips over 4 μm with minimal crosstalk, fast enough to actuate on relevant time scales (20 ms), and scalable by virtue of being electrically addressable. Furthermore, tuning the individual heaters allows for variability in the arrays to be compensated for precisely, resulting in high quality nanopatterning. The addition of tunable actuators transforms cantilever-free scanning probe lithography into a technique capable of true desktop nanofabrication.

  2. An experimental-theoretical correlation study of non-linear bending and torsion deformations of a cantilever beam

    NASA Technical Reports Server (NTRS)

    Dowell, E. H.; Traybar, J.; Hodges, D. H.

    1977-01-01

    An experimental study of the large deformation of a cantilevered beam under a gravity tip load has been made. The beam root is rotated so that the tip load is oriented at various angles with respect to the beam principal axes. Static twist and bending deflections of the tip and bending natural frequencies have been measured as a function of tip load magnitude and orientation. The experimental data are compared with the results of a recently developed non-linear structural theory. Agreement is reasonably good when bending deflections are small compared to the beam span, but systematic differences occur for larger deflections.

  3. Tipping Point

    MedlinePlus Videos and Cool Tools

    ... Tipping Point by CPSC Blogger September 22 appliance child Childproofing CPSC danger death electrical fall furniture head ... TV falls with about the same force as child falling from the third story of a building. ...

  4. Near-Field Spectroscopy with Nanoparticles Deposited by AFM

    NASA Technical Reports Server (NTRS)

    Anderson, Mark S.

    2008-01-01

    An alternative approach to apertureless near-field optical spectroscopy involving an atomic-force microscope (AFM) entails less complexity of equipment than does a prior approach. The alternative approach has been demonstrated to be applicable to apertureless near-field optical spectroscopy of the type using an AFM and surface enhanced Raman scattering (SERS), and is expected to be equally applicable in cases in which infrared or fluorescence spectroscopy is used. Apertureless near-field optical spectroscopy is a means of performing spatially resolved analyses of chemical compositions of surface regions of nanostructured materials. In apertureless near-field spectroscopy, it is common practice to utilize nanostructured probe tips or nanoparticles (usually of gold) having shapes and dimensions chosen to exploit plasmon resonances so as to increase spectroscopic-signal strengths. To implement the particular prior approach to which the present approach is an alternative, it is necessary to integrate a Raman spectrometer with an AFM and to utilize a special SERS-active probe tip. The resulting instrumentation system is complex, and the tasks of designing and constructing the system and using the system to acquire spectro-chemical information from nanometer-scale regions on a surface are correspondingly demanding.

  5. Parallel SPM cantilever arrays for large area surface metrology and lithography

    NASA Astrophysics Data System (ADS)

    Gotszalk, Teodor; Ivanov, Tzvetan; Rangelow, Ivo W.

    2014-04-01

    In this paper technology of scanning probe microscopy (SPM) surface metrology using arrays of piezoresistive thermally actuated cantilevers is discussed. The cantilever architecture presented here makes it possible to image surface topography using sensors operating in parallel. In this way the throughput of the sample imaging is increased, which is of crucial importance in measurements of large area samples. Application of piezoresistive detection scheme makes it possible to investigate quantitatively the interaction between the microprobe and the imaged surface. Integration of the thermal deflection actuator with the spring beam decreases the response time and enables fast and high resolution control of the tip sample distance. The results of topography parallel measurement using 1×4 cantilever array will be presented.

  6. Fabrication of high-density cantilever arrays and through-wafer interconnects

    SciTech Connect

    A. Harley, J.; Abdollahi-Alibeik, S.; Chow, E. M.; Kenney, T. W.; McCarthy, A. M.; McVittie, J. P.; Partridge; Quate, C. F.; Soh, H. T.

    1998-11-03

    Processes to fabricate dense, dry released microstructures with electrical connections on the opposite side of the wafer are described. A 10 x 10 array of silicon and polysilicon cantilevers with high packing density (5 tips/mm2) and high uniformity (<10 µm length variation across the wafer) are demonstrated. The cantilever release process uses a deep SF6/C4F8, plasma etch followed by a HBr plasma etch to accurately release cantilevers. A process for fabricating electrical contacts through the backside of the wafer is also described. Electrodeposited resist, conformal CVD metal deposition and deep SF6/C4F8 plasma etching are used to make 30 µm/side square vias each of which has a resistance of 50 m(omega).

  7. Investigation of static and dynamic behavior of functionally graded piezoelectric actuated Poly-Si micro cantilever probe

    NASA Astrophysics Data System (ADS)

    Pandey, Vibhuti Bhushan; Parashar, Sandeep Kumar

    2016-04-01

    In the present paper a novel functionally graded piezoelectric (FGP) actuated Poly-Si micro cantilever probe is proposed for atomic force microscope. The shear piezoelectric coefficient d15 has much higher value than coupling coefficients d31 and d33, hence in the present work the micro cantilever beam actuated by d15 effect is utilized. The material properties are graded in the thickness direction of actuator by a simple power law. A three dimensional finite element analysis has been performed using COMSOL Multiphysics® (version 4.2) software. Tip deflection and free vibration analysis for the micro cantilever probe has been done. The results presented in the paper shall be useful in the design of micro cantilever probe and their subsequent utilization in atomic force microscopes.

  8. Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor

    NASA Astrophysics Data System (ADS)

    Giessibl, F. J.; Hembacher, S.; Herz, M.; Schiller, Ch; Mannhart, J.

    2004-02-01

    In frequency modulation atomic force microscopy, the stiffness, quality factor and oscillation amplitude of the cantilever are important parameters. While the first atomic resolution results were obtained with amplitudes of a few hundred ångstrom, it has subsequently been shown that smaller amplitudes should result in a better signal-to-noise ratio and an increased sensitivity to the short-range components of the tip-sample interaction. Stable oscillation at small amplitudes is possible if the product of stiffness and amplitude and the energy stored in the oscillating cantilever are large enough. For small amplitudes, stability can be achieved by using stiff cantilevers. Here, we discuss the physical requirements for small amplitude operation and present design criteria and technical details of the qPlus sensor, a self-sensing cantilever with large stiffness that allows small amplitude operation.

  9. Length and Width Effects of Metal Films on Stress-Induced Bending of Surface Micromachined Cantilever Curved Grating

    NASA Astrophysics Data System (ADS)

    Kuo, Ju-Nan

    2012-02-01

    In this study, the length and width effects of metal films on the stress-induced bending of a surface micromachined cantilever curved grating are systematically investigated. A characterization of cantilever curved gratings with various lengths and widths was conducted to observe out-of-plane deformation. A finite element model was established to analyze the deformation. Finite element analysis and experimental results indicate that the commonly used beam theory formula for predicting the deformation of surface micromachined cantilever curved gratings is not valid for these devices. Experiments show that the shape of a cantilever curved grating and residual stress have a close relationship. As the length increases, the residual stress of the metal increases, resulting in a larger out-of-plane deformation of the cantilever curved grating. The tip deflection gradually decreases as the length-to-width ratio of the cantilever curved grating increases. A more reliable shape design of metal films on the stress-induced bending of surface micromachined cantilever curved gratings can thus be achieved.

  10. PREFACE: Non-contact AFM Non-contact AFM

    NASA Astrophysics Data System (ADS)

    Giessibl, Franz J.; Morita, Seizo

    2012-02-01

    This special issue is focussed on high resolution non-contact atomic force microscopy (AFM). Non-contact atomic force microscopy was established approximately 15 years ago as a tool to image conducting and insulating surfaces with atomic resolution. Since 1998, an annual international conference has taken place, and although the proceedings of these conferences are a useful source of information, several key developments warrant devoting a special issue to this subject. In the theoretic field, the possibility of supplementing established techniques such as scanning tunneling microscopy (STM) and Kelvin probe microscopy with atomically resolved force micrsoscopy poses many challenges in the calculation of contrast and contrast reversal. The surface science of insulators, self-assembled monolayers and adsorbates on insulators is a fruitful field for the application of non-contact AFM: several articles in this issue are devoted to these subjects. Atomic imaging and manipulation have been pioneered using STM, but because AFM allows the measurement of forces, AFM has had a profound impact in this field as well. Three-dimensional force spectroscopy has allowed many important insights into surface science. In this issue a combined 3D tunneling and force microscopy is introduced. Non-contact AFM typically uses frequency modulation to measure force gradients and was initially used mainly in a vacuum. As can be seen in this issue, frequency modulation is now also used in ambient conditions, allowing better spatial and force resolution. We thank all of the contributors for their time and efforts in making this special issue possible. We are also very grateful to the staff of IOP Publishing for handling the administrative aspects and for steering the refereeing process. Non-contact AFM contents Relation between the chemical force and the tunnelling current in atomic point contacts: a simple model Pavel Jelínek, Martin Ondrácek and Fernando Flores Theoretical simulation of

  11. Nanomechanical humidity detection through porous alumina cantilevers

    PubMed Central

    Klimenko, Alexey; Lebedev, Vasiliy; Lukashin, Alexey; Eliseev, Andrey

    2015-01-01

    Summary We present here the behavior of the resonance frequency of porous anodic alumina cantilever arrays during water vapor adsorption and emphasize their possible use in the micromechanical sensing of humidity levels at least in the range of 10–22%. The sensitivity of porous anodic aluminium oxide cantilevers (Δf/Δm) and the humidity sensitivity equal about 56 Hz/pg and about 100 Hz/%, respectively. The approach presented here for the design of anodic alumina cantilever arrays by the combination of anodic oxidation and photolithography enables easy control over porosity, surface area, geometric and mechanical characteristics of the cantilever arrays for micromechanical sensing. PMID:26199836

  12. Structural investigations on native collagen type I fibrils using AFM

    SciTech Connect

    Strasser, Stefan; Zink, Albert; Janko, Marek; Heckl, Wolfgang M.; Thalhammer, Stefan . E-mail: stefan.thalhammer@gsf.de

    2007-03-02

    This study was carried out to determine the elastic properties of single collagen type I fibrils with the use of atomic force microscopy (AFM). Native collagen fibrils were formed by self-assembly in vitro characterized with the AFM. To confirm the inner assembly of the collagen fibrils, the AFM was used as a microdissection tool. Native collagen type I fibrils were dissected and the inner core uncovered. To determine the elastic properties of collagen fibrils the tip of the AFM was used as a nanoindentor by recording force-displacement curves. Measurements were done on the outer shell and in the core of the fibril. The structural investigations revealed the banding of the shell also in the core of native collagen fibrils. Nanoindentation experiments showed the same Young's modulus on the shell as well as in the core of the investigated native collagen fibrils. In addition, the measurements indicate a higher adhesion in the core of the collagen fibrils compared to the shell.

  13. Design and manufacture of perpendicular bi-stable cantilever for vibrational energy harvesting on the basis of stochastic resonance

    NASA Astrophysics Data System (ADS)

    Kawano, M.; Zhang, Y.; Zheng, R.; Nakano, K.; Kim, B.

    2015-12-01

    This paper describes extremely simple configuration of novel vibrational energy harvester, which can harness low frequency (less than 5 Hz, such as various environmental vibrations) over a broad frequency band for the first time. A design that utilizes a phenomenon called stochastic resonance can give significantly enhanced vibration mode for increasing efficiency, and simple bi-stable cantilever with tip mass installed a basement vertically fulfils the requirements for stochastic resonance. We fabricated bi-stable cantilever with tip mass and validated whether the cantilever could be used as an effective low frequency vibration energy harvester. In the experiment, when a 1 Hz periodic force and environmental noise vibration were applied, stochastic resonance occurred. The amplitude of the energy harvester increased over tenfold (over 30 mm).

  14. Calibration of the torsional and lateral spring constants of cantilever sensors.

    PubMed

    Parkin, John D; Hähner, Georg

    2014-06-01

    A method suitable for the calibration of the spring constants of all torsional and lateral eigenmodes of micro- and nanocantilever sensors is described. Such sensors enable nanomechanical measurements and the characterization of nanomaterials, for example with atomic force microscopy. The method presented involves the interaction of a flow of fluid from a microchannel with the cantilever beam. Forces imparted by the flow cause the cantilever to bend and induce a measurable change of the torsional and lateral resonance frequencies. From the frequency shifts the cantilever spring constants can be determined. The method does not involve physical contact between the cantilever or its tip and a hard surface. As such it is non-invasive and does not risk damage to the cantilever. Experimental data is presented for two rectangular microcantilevers with fundamental flexural spring constants of 0.046 and 0.154 N m(-1). The experimentally determined torsional stiffness values are compared with those obtained by the Sader method. We demonstrate that the torsional spring constants can be readily calibrated using the method with an accuracy of around 15%. PMID:24807706

  15. Piezoresistive cantilever working in a shear force mode for in situ characterization of exposed micro- and nanostructures

    NASA Astrophysics Data System (ADS)

    Sierakowski, Andrzej; Kopiec, Daniel; Janus, Paweł; Ekwińska, Magdalena; Płuska, Mariusz; Grabiec, Piotr; Gotszalk, Teodor

    2014-04-01

    This paper presents a method of characterization micro- and nanostructures defined in a photolithography process. To implement this method a measurement system composed of an atomic force microscope (AFM) integrated with a system for maskless lithography was developed. This integration enables exposed patterns to be examined in situ, without any necessity for a developing process. The microscope works in a shear force mode, uses a cantilever with a piezoresistive method of detecting deflection and can be used for measuring surfaces with high aspect ratio by applying an appropriate technology of sharpening in a focused ion beam process. The cantilever fabrication process, its calibration and examination procedures are presented. Finally, the AFM images of structures scanned directly after exposure are shown.

  16. Cantilevers orthodontics forces measured by fiber sensors

    NASA Astrophysics Data System (ADS)

    Schneider, Neblyssa; Milczewski, Maura S.; de Oliveira, Valmir; Guariza Filho, Odilon; Lopes, Stephani C. P. S.; Kalinowski, Hypolito J.

    2015-09-01

    Fibers Bragg Gratings were used to evaluate the transmission of the forces generates by orthodontic mechanic based one and two cantilevers used to move molars to the upright position. The results showed levels forces of approximately 0,14N near to the root of the molar with one and two cantilevers.

  17. Nanoscale crystallization of phase change Ge2Sb2Te5 film with AFM lithography.

    PubMed

    Kim, JunHo

    2010-01-01

    We have made nanoindents on Ge(2)Sb(2)Te(5)(GST) films using electric field-assisted atomic force microscope (AFM) lithography. GST shows increase of material density and electric conductivity as it changes from amorphous to crystalline phases. By applying electric field between AFM probe-tip and GST surface, nanoscale crystallization could be induced on tip contact area. As the crystallized GST exhibits increase of material density, that is to say depression of volume, nanoindented surface with crystallization is created on host amorphous GST (a-GST) film. For the AFM lithography, a highly conductive tip, which showed voltage-switching characteristics in current-voltage spectroscopy of GST film, was found to be very suitable for recording and sensing crystallized nanoindents on the GST film. By varying sample bias voltages, we performed nanoscale crystallization, and measured the nanostructured film in AFM conductance-image (C-image) mode and topography-image (T-image) mode, simultaneously. Two types of crystallized wires were fabricated on (a-GST) film. Type-I was sensed in only C-image, whereas Type-II was sensed in both C-image and T-image. These nanowires are discussed in terms of crystallization of GST and sensitivity of current (or topography) sensing. By repeated lithography, larger size of nanoindented wires were also produced, which indicates line-dimension controllability of AFM lithography. PMID:20853405

  18. Response of long, flexible cantilever beams applied root motions. [spacecraft structures

    NASA Technical Reports Server (NTRS)

    Fralich, R. W.

    1976-01-01

    Results are presented for an analysis of the response of long, flexible cantilever beams to applied root rotational accelerations. Maximum values of deformation, slope, bending moment, and shear are found as a function of magnitude and duration of acceleration input. Effects of tip mass and its eccentricity and rotatory inertia on the response are also investigated. It is shown that flexible beams can withstand large root accelerations provided the period of applied acceleration can be kept small relative to the beam fundamental period.

  19. Manufacturing process of nanofluidics using afm probe

    NASA Astrophysics Data System (ADS)

    Karingula, Varun Kumar

    A new process for fabricating a nano fluidic device that can be used in medical application is developed and demonstrated. Nano channels are fabricated using a nano tip in indentation mode on AFM (Atomic Force Microscopy). The nano channels are integrated between the micro channels and act as a filter to separate biomolecules. Nano channels of 4 to7 m in length, 80nm in width, and at varying depths from 100nm to 850 nm allow the resulting device to separate selected groups of lysosomes and other viruses. Sharply developed vertical micro channels are produced from a deep reaction ion etching followed by deposition of different materials, such as gold and polymers, on the top surface, allowing the study of alternative ways of manufacturing a nanofluidic device. PDMS (Polydimethylsiloxane) bonding is performed to close the top surface of the device. An experimental setup is used to test and validate the device by pouring fluid through the channels. A detailed cost evaluation is conducted to compare the economical merits of the proposed process. It is shown that there is a 47:7% manufacturing time savings and a 60:6% manufacturing cost savings.

  20. Single-cycle-PLL detection for real-time FM-AFM applications.

    PubMed

    Schlecker, Benedikt; Dukic, Maja; Erickson, Blake; Ortmanns, Maurits; Fantner, Georg; Anders, Jens

    2014-04-01

    In this paper we present a novel architecture for phase-locked loop (PLL) based high-speed demodulation of frequency-modulated (FM) atomic force microscopy (AFM) signals. In our approach, we use single-sideband (SSB) frequency upconversion to translate the AFM signal from the position sensitive detector to a fixed intermediate frequency (IF) of 10 MHz. In this way, we fully benefit from the excellent noise performance of PLL-based FM demodulators still avoiding the intrinsic bandwidth limitation of such systems. In addition, the upconversion to a fixed IF renders the PLL demodulator independent of the cantilever's resonance frequency, allowing the system to work with a large range of cantilever frequencies. To investigate if the additional noise introduced by the SSB upconverter degrades the system noise figure we present a model of the AM-to-FM noise conversion in PLLs incorporating a phase-frequency detector. Using this model, we can predict an upper corner frequency for the demodulation bandwidth above which the converted noise from the single-sideband upconverter becomes the dominant noise source and therefore begins to deteriorate the overall system performance. The approach is validated by both electrical and AFM measurements obtained with a PCB-based prototype implementing the proposed demodulator architecture. PMID:24760947

  1. Oscillations of end loaded cantilever beams

    NASA Astrophysics Data System (ADS)

    Macho-Stadler, E.; Elejalde-García, M. J.; Llanos-Vázquez, R.

    2015-09-01

    This article presents several simple experiments based on changing transverse vibration frequencies in a cantilever beam, when acted on by an external attached mass load at the free end. By using a mechanical wave driver, available in introductory undergraduate laboratories, we provide various experimental results for end loaded cantilever beams that fit reasonably well into a linear equation. The behaviour of the cantilever beam’s weak-damping resonance response is studied for the case of metal resonance strips. As the mass load increases, a more pronounced decrease occurs in the fundamental frequency of beam vibration. It is important to note that cantilever construction is often used in architectural design and engineering construction projects but current analysis also predicts the influence of mass load on the sound generated by musical free reeds with boundary conditions similar to a cantilever beam.

  2. Resonance response of scanning force microscopy cantilevers

    SciTech Connect

    Chen, G.Y.; Warmack, R.J.; Thundat, T.; Allison, D.P. ); Huang, A. )

    1994-08-01

    A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor [ital Q]. Helium has the lowest viscosity, resulting in the highest [ital Q], and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.

  3. A cantilever array-based artificial nose

    PubMed

    Baller; Lang; Fritz; Gerber; Gimzewsk; Drechsler; Rothuizen; Despont; Vettiger; Battiston; Ramseyer; Fornaro; Meyer; Guntherodt

    2000-02-01

    We present quantitative and qualitative detection of analyte vapors using a microfabricated silicon cantilever array. To observe transduction of physical and chemical processes into nanomechanical motion of the cantilever, swelling of a polymer layer on the cantilever is monitored during exposure to the analyte. This motion is tracked by a beam-deflection technique using a time multiplexing scheme. The response pattern of eight cantilevers is analyzed via principal component analysis (PCA) and artificial neural network (ANN) techniques, which facilitates the application of the device as an artificial chemical nose. Analytes tested comprise chemical solvents, a homologous series of primary alcohols, and natural flavors. First differential measurements of surface stress change due to protein adsorption on a cantilever array are shown using a liquid cell. PMID:10741645

  4. Measurements of laboratory turbulence with the 2d-Laser Cantilever Anemometer

    NASA Astrophysics Data System (ADS)

    Puczylowski, Jaroslaw; Peinke, Joachim; Hoelling, Michael

    2013-11-01

    A newly developed anemometer, the 2d-Laser Cantilever Anemometer, was used to measure the two-dimensional wind speed vector in laboratory-generated turbulence. The anemometer provides a temporal and spatial resolution comparable or even higher to those of commercial hot-wires and thus is an excellent alternative for high-resolution measurements. The 2d-Laser Cantilever Anemometer uses a previously unseen measurement technique in the range of anemometers. The principle is adopted from atomic force microscopes (AFM). A tiny micro-structured cantilever is brought into the airflow, where it experiences a drag force due to the moving fluid. The resulting deflection is measured using the laser pointer principle. Unlike the measuring principle of hot-wires this technique can be applied in challenging environments such as in liquids or very close to walls. Our comparing measurements with the 2d-Laser Cantilever Anemometer and an x-wire were carried out in the wake of rigid bodies and grids. The results show a great agreement with regards to the increment statistics on various scales, power spectra and turbulence intensity, thus proving the new anemometer.

  5. Comparison of dynamic lever STM and noncontact AFM

    NASA Astrophysics Data System (ADS)

    Guggisberg, M.; Bammerlin, M.; Lüthi, R.; Loppacher, C.; Battiston, F.; Lü, J.; Baratoff, A.; Meyer, E.; Güntherodt, H.-J.

    We investigate interaction effects which occur in scanning tunneling microscopy (STM) by performing local force spectroscopy with an oscillating tip while imaging Si(111)7×7 terraces in the dynamic lever STM mode (constant time-averaged current). It is found that true atomic resolution is achieved close to the minimum of the resonance frequency vs. distance curve and even closer to the sample. On the other hand true atomic resolution in noncontact AFM (constant frequency shift) is expected several nm away from this minimum, in the range where the frequency shift becomes more negative with decreasing distance.

  6. TIP list

    SciTech Connect

    Ludwig, M E

    2006-06-22

    Subcontractors and vendors providing services, including the installation of purchased goods, are required to complete a TIP List. This list does not include every Environment, Safety, and Health (ES&H) related concern at LLNL. It is intended to highlight major concerns common to most on-site service activities.

  7. Technology Tips

    ERIC Educational Resources Information Center

    Santos-Trigo, Manuel

    2004-01-01

    A dynamic program for geometry called Cabri Geometry II is used to examine properties of figures like triangles and make connections with other mathematical ideas like ellipse. The technology tip includes directions for creating such a problem with technology and suggestions for exploring it.

  8. Novel Polymer Linkers for Single Molecule AFM Force Spectroscopy

    PubMed Central

    Tong, Zenghan; Mikheikin, Andrey; Krasnoslobodtsev, Alexey; Lv, Zhengjian; Lyubchenko, Yuri L.

    2013-01-01

    Flexible polymer linkers play an important role in various imaging and probing techniques that require surface immobilization, including atomic force microscopy (AFM). In AFM force spectroscopy, polymer linkers are necessary for the covalent attachment of molecules of interest to the AFM tip and the surface. The polymer linkers tether the molecules and provide their proper orientation in probing experiments. Additionally, the linkers separate specific interactions from nonspecific short-range adhesion and serve as a reference point for the quantitative analysis of single molecule probing events. In this report, we present our results on the synthesis and testing of a novel polymer linker and the identification of a number of potential applications for its use in AFM force spectroscopy experiments. The synthesis of the linker is based on the well-developed phosphoramidate (PA) chemistry that allows the routine synthesis of linkers with predetermined lengths and PA composition. These linkers are homogeneous in length and can be terminated with various functional groups. PA linkers with different functional groups were synthesized and tested in experimental systems utilizing different immobilization chemistries. We probed interactions between complementary DNA oligonucleotides; DNA and protein complexes formed by the site-specific binding protein SfiI; and interactions between amyloid peptide (Aβ42). The results of the AFM force spectroscopy experiments validated the feasibility of the proposed approach for the linker design and synthesis. Furthermore, the properties of the tether (length, functional groups) can be adjusted to meet the specific requirements for different force spectroscopy experiments and system characteristics, suggesting that it could be used for a large number of various applications. PMID:23624104

  9. Recent CD AFM probe developments for sub-45 nm technology nodes

    NASA Astrophysics Data System (ADS)

    Liu, Hao-Chih; Osborne, Jason R.; Dahlen, Gregory A.; Greschner, Johann; Bayer, Thomas; Kalt, Samuel; Fritz, Georg

    2008-03-01

    This paper reports on new developments of advanced CD AFM probes after the prior introduction of "trident probes" in SPIE Advanced Lithography 2007 [1]. Trident probes, having sharpened extensions in the tip apex region, make possible bottom CD measurements within a few nanometers of the feature bottom corner; an area where other CD probes have difficulties due to tip shape limitations. Moreover, new metrology applications of trident probes have been developed for novel devices such as FinFET and vertical read/write hard disk heads. For ever smaller technology nodes, new probes evolved from the design of the trident probe. For example, the number of sharpened tip flares was reduced from three (trident) to two (bi-pod) to prevent possible interference of the third leg in the slow scan direction, as shown in Figure 3. Maintaining tip lateral stiffness as the tip size shrinks to less than 30 nm is vital for successful scanning. Consequently, a significant recent improvement is the change of probe shank cross-sectional geometry in order to maintain tip vertical aspect ratio of 1:5 (and lateral stiffness > 1 N/m). Finally, modifications of probe substrate are proposed and evaluated for current and new CD AFM systems. Hydrophobic, self-assembled monolayer (SAM) coatings were applied on CD probes to reduced tip "pull-away" distance1 during CD AFM scanning. Test results show that the pull away distance can be reduced more than 5 times on average (in some cases, by a factor of 15). Consequently, use of hydrophobic SAM coatings on CD probes mitigates pull-away distance thus allowing narrow trench CD measurements. We discuss limitations of prior CD AFM probes and design considerations of new CD probes. The characterization of first prototypes and evaluation of scan performance are presented in this work.

  10. High-speed force mapping on living cells with a small cantilever atomic force microscope.

    PubMed

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed. PMID:25085142

  11. High-speed force mapping on living cells with a small cantilever atomic force microscope

    NASA Astrophysics Data System (ADS)

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  12. High-speed force mapping on living cells with a small cantilever atomic force microscope

    SciTech Connect

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  13. Thermal writing using a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Mamin, H. J.

    1996-07-01

    Resistive heating of an atomic force microscope tip was used to perform thermally induced surface modifications. Heating was achieved by dissipating power in the legs of an electrically conducting silicon cantilever. Temperatures of up to 170 °C were obtained using 40 mW of input power. Electrical measurements used to monitor the temperature showed thermal time constants of 0.35-0.45 ms, depending on whether the tip was in contact with a substrate. The heated tip was used to demonstrate thermomechanical writing on a polycarbonate substrate, as well as thermal writing of an optical phase change material.

  14. Probing the PEDOT:PSS/cell interface with conductive colloidal probe AFM-SECM

    NASA Astrophysics Data System (ADS)

    Knittel, P.; Zhang, H.; Kranz, C.; Wallace, G. G.; Higgins, M. J.

    2016-02-01

    Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive colloid under physiological conditions. Moreover, such colloids can be modified by electrochemical polymerization resulting, e.g. in conductive polymer-coated spheres, which in addition may be loaded with specific dopants. In contrast to other AFM-based single cell force spectroscopy measurements, these probes allow adhesion measurements at the cell-biomaterial interface on multiple cells in a rapid manner while the properties of the polymer can be changed by applying a bias. In addition, spatially resolved electrochemical information e.g., oxygen reduction can be obtained simultaneously. Conductive colloid AFM-SECM probes modified with poly(3,4-ethylenedioxythiophene) doped with polystyrene sulfonate (PEDOT:PSS) are used for single cell force measurements in mouse fibroblasts and single cell interactions are investigated as a function of the applied potential.Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive colloid under physiological conditions. Moreover, such colloids can be modified by electrochemical polymerization resulting, e.g. in conductive polymer-coated spheres, which in addition may be loaded with specific dopants. In contrast to other AFM-based single cell force spectroscopy measurements, these probes allow adhesion measurements at the cell-biomaterial interface on multiple cells in a rapid manner while the properties of the polymer can be changed by applying a bias. In addition, spatially resolved electrochemical

  15. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    SciTech Connect

    Liu Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-15

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  16. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    NASA Astrophysics Data System (ADS)

    Liu, Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-01

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  17. Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Nie, H.-Y.; McIntyre, N. S.

    2007-02-01

    Liquid 1-decanethiol was confined on an atomic force microscope (AFM) tip apex and the effect was investigated by measuring amplitude-distance curves in dynamic force mode. Within the working distance in the dynamic force mode AFM, the thiol showed strong interactions bridging between a gold-coated probe tip and a gold-coated Si substrate, resulting in unstable amplitude and noisy AFM images. We show that under such a situation, the amplitude change is dominated by the extra forces induced by the active material loaded on the tip apex, overwhelming the amplitude change caused by the geometry of the sample surface, thus resulting in noise in the image the tip collects. We also show that such a contaminant may be removed from the apex by pushing the tip into a material soft enough to avoid damage to the tip.

  18. Device level 3D characterization using PeakForce AFM

    NASA Astrophysics Data System (ADS)

    Timoney, Padraig; Zhang, Xiaoxiao; Vaid, Alok; Hand, Sean; Osborne, Jason; Milligan, Eric; Feinstein, Adam

    2016-03-01

    Traditional metrology solutions face a range of challenges at the 1X node such as three dimensional (3D) measurement capabilities, shrinking overlay and critical dimension (CD) error budgets driven by multi-patterning and via in trench CD measurements. With advent of advanced technology nodes and 3D processing, an increasing need is emerging for in-die metrology including across-structure and structure-to-structure characterization. A myriad of work has emerged in the past few years intending to address these challenges from various aspects; in-die OCD with reduced spot size and tilt beam on traditional critical dimension scanning electron microscopy (CDSEM) for height measurements. This paper explores the latest capability offered by PeakForceTM Tapping Atomic Force Microscopy (PFT-AFM). The use of traditional harmonic tapping mode for scanning high aspect ratio, and complex "3D" wafer structures, results in limited depth probing capability as well as excessive tip wear. These limitations arise due to the large tip-sample interaction volume in such confined spaces. PeakForce Tapping eliminates these limitations through direct real time control of the tip-sample interaction contact force. The ability of PeakForce to measure, and respond directly to tip- sample interaction forces results in more detailed feature resolution, reduced tip wear, and improved depth capability. In this work, the PFT-AFM tool was applied for multiple applications, including the 14nm fin and replacement metal gate (RMG) applications outlined below. Results from DOE wafers, detailed measurement precision studies and correlation to reference metrology are presented for validation of this methodology. With the fin application, precision of 0.3nm is demonstrated by measuring 5 dies with 10 consecutive runs. Capability to resolve within-die and localized within-macro height variation is also demonstrated. Results obtained from the fin measurements support the increasing trend that measurements

  19. Factors influencing elastic stresses in double cantilever beam specimens

    NASA Technical Reports Server (NTRS)

    Crews, J. H., Jr.; Shivakumar, K. N.; Raju, I. S.

    1986-01-01

    An elastic stress analysis was conducted for a double cantilever beam (DCB) specimen using finite-element methods. The purpose of this study was to identify the important parameters that influence stresses ahead of the delamination front. The study focused on an aluminum DCB specimen, typical of adhesively-bonded joints, and on a graphite/epoxy specimen representing a cocured composite. Opening mode sigma sub y stresses ahead of the crack tip were calculated and compared with those for a monolithic reference specimen. Beyond the singularity-dominated region very near the crack tip, the sigma sub y distribution was elevated compared to the monolithic case. Both the adhesive thickness and the adherend transverse (thickness-direction) stiffness were found to influence the elevation of sigma sub y. In contrast, adherend thickness and longitudinal stiffness has very little effect on this stress distribution. Estimates for adhesive yielding beyond the aluminum DCB crack tip showed that both the area and height of the plastic zone increased to a peak value for increasing adhesive thicknesses. Results from this study would provide insight for comparing data from different DCB specimens and for designing new DCB specimens.

  20. Factors influencing elastic stresses in double cantilever beam specimens

    NASA Technical Reports Server (NTRS)

    Crews, J. H., Jr.; Shivakumar, K. N.; Raju, I. S.

    1988-01-01

    An elastic stress analysis was conducted for a double cantilever beam (DCB) specimen using finite-element methods. The purpose of this study was to identify the important parameters that influence stresses ahead of the delamination front. The study focused on an aluminum DCB specimen, typical of adhesively-bonded joints, and on a graphite/epoxy specimen representing a cocured composite. Opening mode sigma sub y stresses ahead of the crack tip were calculated and compared with those for a monolithic reference specimen. Beyond the singularity-dominated region very near the crack tip, the sigma sub y distribution was elevated compared to the monolithic case. Both the adhesive thickness and the adherend transverse (thickness-direction) stiffness were found to influence the elevation of sigma sub y. In contrast, adherend thickness and longitudinal stiffness has very little effect on this stress distribution. Estimates for adhesive yielding beyond the aluminum DCB crack tip showed that both the area and height of the plastic zone increased to a peak value for increasing adhesive thicknesses. Results from this study would provide insight for comparing data from different DCB specimens and for designing new DCB specimens.

  1. Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid

    SciTech Connect

    Nishida, Shuhei; Kobayashi, Dai; Sakurada, Takeo; Nakazawa, Tomonori; Hoshi, Yasuo; Kawakatsu, Hideki

    2008-12-15

    The authors present an optically based method combining photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid. The frequency spectrum of a silicon cantilever measured in water over frequencies ranging up to 10 MHz shows that the method allows us to excite and detect higher modes, from fundamental to fifth flexural, without enhancing spurious resonances. By reducing the tip oscillation amplitude using higher modes, the average tip-sample force gradient due to chemical bonds is effectively increased to achieve high-spatial-resolution imaging in liquid. The method's performance is demonstrated by atomic resolution imaging of a mica surface in water obtained using the second flexural mode with a small tip amplitude of 99 pm; individual atoms on the surface with small height differences of up to 60 pm are clearly resolved.

  2. Temperature Dependence Study of Noncontact Afm Images Using Molecular Dynamics Simulations

    NASA Astrophysics Data System (ADS)

    Nejat Pishkenari, Hossein; Meghdari, Ali

    The effect of temperature on the noncontact atomic force microscopy (NC-AFM) surface imaging is investigated with the aid of molecular dynamics (MD) analysis based on the Sutton-Chen (SC) interatomic potential. Particular attention is devoted to the tip and sample flexibility at different temperatures. When a gold coated probe is brought close to the Au (001) surface at high temperatures, the tip and surface atoms are pulled together and their distance becomes smaller. The tip and sample atoms displacement varies in the different environment temperatures and this leads to the different interaction forces. Along this line, to study the effect of temperature on the resulting images, we have employed the well-known NC-AFM model and carried out realistic non-equilibrium MD 3D simulations of atomic scale imaging at different close approach positions to the surface.

  3. Ultra large deflection of thin PZT/aluminium cantilever beam

    NASA Astrophysics Data System (ADS)

    Seveno, Raynald; Guiffard, Benoit; Regoin, Jean-Pierre

    2015-04-01

    Flexible piezoelectric cantilever beam has been realized by depositing lead zirconate titanate (PZT) thin film (4.5 μm) by chemical solution deposition (CSD) onto very thin aluminium foil (16 μm). The tip deflection of the beam has been measured as a function of the frequency of the applied sinusoidal voltage to the PZT film for different amplitudes. Resonance curves have been compared to a classical model of an oscillating system under sinusoidal stress with a very good agreement. Despite of weak ferroelectric properties (remnant polarization: 13 μC/cm2), ultra-large deflection amplitudes have been measured under very moderate applied voltage values: 750 μm@10 V for quasi-static mode and 5 mm@10 V at the resonance frequency ( 12 Hz), which makes this PZT/aluminium composite film very promising for highly flexible actuation applications where large displacements are wanted.

  4. Self-reciprocating radioisotope-powered cantilever

    NASA Astrophysics Data System (ADS)

    Li, Hui; Lal, Amit; Blanchard, James; Henderson, Douglass

    2002-07-01

    A reciprocating cantilever utilizing emitted charges from a millicurie radioisotope thin film is presented. The actuator realizes a direct collected-charge-to-motion conversion. The reciprocation is obtained by self-timed contact between the cantilever and the radioisotope source. A static model balancing the electrostatic and mechanical forces from an equivalent circuit leads to an analytical solution useful for device characterization. Measured reciprocating periods agree with predicted values from the analytical model. A scaling analysis shows that microscale arrays of such cantilevers provide an integrated sensor and actuator platform.

  5. Development of double-cantilever infrared detectors

    NASA Astrophysics Data System (ADS)

    Huang, Shusen

    Detection and imaging of infrared (IR) radiation are of great importance to a variety of military and civilian applications. Recent advances in microelectromechanical systems (MEMS) have led to the development of uncooled cantilever IR focal plane arrays (FPAs), which function based on the bending of bimaterial cantilevers upon the absorption of IR energy. In this dissertation, capacitive-based double-cantilever IR FPAs, which have a potential of reaching a noise-equivalent temperature difference (NETD) approaching the theoretical limit, i.e., <10 mK, are developed. Each pixel in the proposed double-cantilever IR FPAs consists of two facing bimaterial cantilevers: one bends upward and the other downward upon IR radiation, resulting in an extremely high sensitivity of the device. It is predicted that the NETD of the double-cantilever IR FPAs is about 60% of the current single-cantilever IR FPAs, which is a significant improvement of device performance. A surface micromachining module with polyimide as a sacrificial material is developed for the fabrication of both simplified single- and double-cantilever FPAs. It is found the as-fabricated FPAs are curved because of the imbalanced residual stresses (strains) in thin films developed in the fabrication processes. In this dissertation, therefore, the general relationship between the residual strain and the resultant elastic bending deformation is modeled. A thorough investigation of residual stresses in cantilever IR materials and structures is then conducted using the theory developed in this dissertation. Furthermore, thermal-cycling experiments reveal that the residual stresses in IR materials, i.e., plasma-enhanced chemical vapor deposited (PECVD) SiNx and electron beam (Ebeam) AI, can be significantly modified by thermal annealing. Therefore, an engineering approach to flattening IR FPAs is developed by using rapid thermal annealing (RTA). Finally, this dissertation demonstrates the thermal detection of cantilever

  6. Investigation of the Mechanoelectrical Transduction at Single Stereocilia by Afm

    NASA Astrophysics Data System (ADS)

    Langer, M. G.; Fink, S.; Löffler, K.; Koitschev, A.; Zenner, H.-P.

    2003-02-01

    The transduction of sound into an electrical signal in the inner ear is closely related to the mechanical properties of the hair bundles cytoskeleton and cross-linkage. In this study the effect of lateral cross-links on hair bundle mechanics and the transduction current response is demonstrated on the level of individual stereocilia. For experiments stereocilia of outer hair cells of postnatal rats (P3 - P8) were scanned with a sharp AFM tip at nanometerscale. Transduction currents were simultaneously recorded in the whole-cell-recording mode with patch clamp. AFM was used as a nanotool for local mechanical stimulation and force measurement at stereocilia whereas patch clamp serves as a detector for the electrical response of the cell. In a first experiment force transmission between adjacent stereocilia of the V- and W- shaped hair bundles of outer hair cells was investigated. Results showed that a force exerted to a single stereocilium declined to 36 % at the nearest adjacent stereocilium of the same row. This result supposes AFM to be convenient for local displacement of single stereocilia. For control, the local response of transduction channels was measured at single stereocilia of the same hair bundle. Measured transduction current amplitudes ranged from 9 to 49 pA supposing an opening of one to five transduction channels. Both, weak force transmission by lateral cross-links and small transduction current amplitudes indicate a weak mechanical interaction between individual stereocilia of the tallest row of stereocilia of outer hair cells from postnatal rats.

  7. Study of relaxation and transport processes by means of AFM based dielectric spectroscopy

    SciTech Connect

    Miccio, Luis A.

    2014-05-15

    Since its birth a few years ago, dielectric spectroscopy studies based on atomic force microscopy (AFM) have gained a growing interest. Not only the frequency and temperature ranges have become broader since then but also the kind of processes that can be studied by means of this approach. In this work we analyze the most adequate experimental setup for the study of several dielectric processes with a spatial resolution of a few nanometers by using force mode AFM based dielectric spectroscopy. Proof of concept experiments were performed on PS/PVAc blends and PMMA homopolymer films, for temperatures ranging from 300 to 400 K. Charge transport processes were also studied by this approach. The obtained results were analyzed in terms of cantilever stray contribution, film thickness and relaxation strength. We found that the method sensitivity is strongly coupled with the film thickness and the relaxation strength, and that it is possible to control it by using an adequate experimental setup.

  8. Probing of local dissolution of Al-alloys in chloride solutions by AFM and SECM

    NASA Astrophysics Data System (ADS)

    Davoodi, A.; Pan, J.; Leygraf, C.; Norgren, S.

    2006-05-01

    Local dissolution of Al alloys was probed in situ in chloride solutions by using atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM). Preferential dissolution in the boundary region between some intermetallic particles (IMPs) and alloy matrix, and trench formation around large IMPs during free immersion and under electrochemical anodic polarization were observed, which indicate different dissolution behavior associated to different types of IMPs. Moreover, by using an integrated AFM/SECM system with a dual mode cantilever/microelectrode probe, simultaneous probing of electrochemical active sites and topographic changes over the same area was performed with sub-micron resolution. This allowed the ongoing localized corrosion processes related to the IMP to be revealed.

  9. Laboratory tests on mercury emission monitoring with resonating gold-coated silicon cantilevers.

    PubMed

    Drelich, Jaroslaw; White, Calvin L; Xu, Zhenghe

    2008-03-15

    To measure extremely low concentrations of mercury vapor in gases as encountered in flue gases of coal-fired power plants, accurate and reliable online and/or portable mercury detection systems are needed. As discussed in this communication, resonating silicon-based cantilevers coated with thin films of gold change their resonant frequency when exposed to mercury vapors and could serve as the basis for such sensing devices. Two different types of commercial AFM cantilevers, which differed by physical dimensions and surface finish, were coated with a 10 nm film of gold and were tested in streams of argon containing mercury. The argon flow rates ranged from 5.7 to 57.4 ml/min, carrying mercury vapors at concentrations between 37 and 700 microg/m3. The results show that smaller cantilevers (approximately 140 microm x 40 microm x 4 microm) with a resonant frequency of 270-275 kHz were sensitive to less than 10 picograms of mercury, whereas larger cantilevers (approximately 245 microm x 50 microm x 7 microm) with a resonant frequency of 155-165 kHz have a sensitivity about 10 times lower. The results indicate that the kinetics of mercury capture by the gold coating follows a simple power law-correlation with the mass change (delta m) being proportional to t(n), where t is the capture time and n depends strongly on the concentration of mercury in the gas. It is also demonstrated that the mercury can be stripped off the gold coating by heating to 350 degrees C, which would allowthe cantilevers to be regenerated and reused. PMID:18409639

  10. Generation of squeezing: magnetic dipoles on cantilevers

    NASA Astrophysics Data System (ADS)

    Seok, Hyojun; Singh, Swati; Steinke, Steven; Meystre, Pierre

    2011-05-01

    We investigate the generation of motional squeezed states in a nano-mechanical cantilever. Our model system consists of a nanoscale cantilever - whose center-of-mass motion is initially cooled to its quantum mechanical ground state - magnetically coupled a classically driven mechanical tuning fork. We show that the magnetic dipole-dipole interaction can produce significant phonon squeezing of the center-of-mass motion of the cantilever, and evaluate the effect of various dissipation channels, including the coupling of the cantilever to a heat bath and phase and amplitude fluctuations in the oscillating field driving the tuning fork. US National Science Foundation, the US Army Research Office, DARPA ORCHID program through a grant from AFOSR.

  11. Piezoresistive Cantilever Performance—Part II: Optimization

    PubMed Central

    Park, Sung-Jin; Doll, Joseph C.; Rastegar, Ali J.; Pruitt, Beth L.

    2010-01-01

    Piezoresistive silicon cantilevers fabricated by ion implantation are frequently used for force, displacement, and chemical sensors due to their low cost and electronic readout. However, the design of piezoresistive cantilevers is not a straightforward problem due to coupling between the design parameters, constraints, process conditions, and performance. We systematically analyzed the effect of design and process parameters on force resolution and then developed an optimization approach to improve force resolution while satisfying various design constraints using simulation results. The combined simulation and optimization approach is extensible to other doping methods beyond ion implantation in principle. The optimization results were validated by fabricating cantilevers with the optimized conditions and characterizing their performance. The measurement results demonstrate that the analytical model accurately predicts force and displacement resolution, and sensitivity and noise tradeoff in optimal cantilever performance. We also performed a comparison between our optimization technique and existing models and demonstrated eight times improvement in force resolution over simplified models. PMID:20333323

  12. Double sided surface stress cantilever sensor

    NASA Astrophysics Data System (ADS)

    Rasmussen, P. A.; Grigorov, A. V.; Boisen, A.

    2005-05-01

    Micromachined cantilevers, originally developed for use in atomic force microscopy, are gaining more and more interest as biochemical sensors, where the way in which the binding of chemical species changes the mechanical properties of the cantilever is utilized. Mass and stiffness changes are measured on resonating structures (Cherian and Thundat 2002 Appl. Phys. Lett. 80 2219-21 Gupta et al 2004 Appl. Phys. Lett. 84 1976-8), whereas changes in surface energy from the binding event are measured as static deflections of cantilevers (Savran et al 2004 Anal. Chem. 76 3194-8). The latter measurement type is referred to as a surface stress sensor and it is the description of a new and more sensitive cantilever surface stress measurement technique that is the topic of this paper.

  13. Cantilever based optical interfacial force microscope

    NASA Astrophysics Data System (ADS)

    Bonander, Jeremy R.; Kim, Byung I.

    2008-03-01

    We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

  14. Charge Measurement of Atoms and Atomic Resolution of Molecules with Noncontact AFM

    NASA Astrophysics Data System (ADS)

    Gross, Leo

    2010-03-01

    Individual gold and silver adatoms [1] and pentacene molecules [2] on ultrathin NaCl films on Cu(111) were investigated using a qPlus tuning fork atomic force microscope (AFM) operated at 5 Kelvin with oscillation amplitudes in the sub-ångstrom regime. Charging a gold adatom by one electron charge increased the force on the AFM tip by a few piconewtons. Employing Kelvin probe force microscopy (KPFM) we also measured the local contact potential difference (LCPD). We observed that the LCPD is shifted depending on the sign of the charge and allows the discrimination of positively charged, neutral, and negatively charged atoms. To image pentacene molecules we modified AFM tips by means of vertical manipulation techniques, i.e. deliberately picking up known atoms and molecules, such as Au, Ag, Cl, CO, and pentacene. Using a CO terminated tip we resolved all individual atoms and bonds within a pentacene molecule. Three dimensional force maps showing the site specific distance dependence above the molecule were extracted. We compared our experimental results with density functional theory (DFT) calculations to gain insight on the physical origin of AFM contrast formation. We found that atomic resolution is only obtained due to repulsive force contributions originating from the Pauli exclusion principle. [4pt] [1] L. Gross, F. Mohn, P. Liljeroth, J. Repp, F. J. Giessibl, G. Meyer, Science 324, 1428 (2009). [0pt] [2] L. Gross, F. Mohn, N. Moll, P. Liljeroth, G. Meyer, Science 325, 1110 (2009).

  15. Relationship between model bacterial peptidoglycan network structures and AFM force-distance curves

    NASA Astrophysics Data System (ADS)

    Brown, Aidan; Wickham, Robert; Touhami, Ahmed; Dutcher, John

    2010-03-01

    Recent atomic force microscopy (AFM) measurements have involved pulling on Gram-negative bacterial sacculi with the AFM tip as a means of distinguishing between different proposed structures of the peptidoglycan network. The goal of the present study is to provide the theoretical connection between a given network structure and its response to the pulling force. We model the glycan strands as hinged rods, and the peptide cross-links as wormlike chains. Using Monte Carlo simulation to equilibrate the three-dimensional network, subject to a fixed AFM tip-to-substrate distance, we can compute the force exerted by the network on the AFM tip. The effects of adhesion of the sacculi to the substrate and enzymatic action on the network are included. We have modeled both the layered and the scaffold model for the peptidoglycan network structure. We have compared our theoretical force-distance curves for each network structure with experimental curves to determine which structure provides the best agreement with experiment.

  16. Single-Crystal Diamond Nanowire Tips for Ultrasensitive Force Microscopy.

    PubMed

    Tao, Y; Degen, C L

    2015-12-01

    We report the fabrication, integration, and assessment of sharp diamond tips for ultrasensitive force microscopy experiments. Two types of tips, corresponding to the upper and lower halves of a diamond nanowire, were fabricated by top-down plasma etching from a single-crystalline substrate. The lower, surface-attached halves can be directly integrated into lithographically defined nanostructures, like cantilevers. The upper, detachable halves result in diamond nanowires with a tunable diameter (50-500 nm) and lengths of a few microns. Tip radii were around 10 nm and tip apex angles around 15°. We demonstrate the integration of diamond nanowires for use as scanning tips onto ultrasensitive pendulum-style silicon cantilevers. We find the noncontact friction and frequency jitter to be exceptionally low, with no degradation in the intrinsic mechanical quality factor (Q ≈ 130,000) down to tip-to-surface distances of about 10 nm. Our results are an encouraging step toward further improvement of the sensitivity and resolution of force-detected magnetic resonance imaging. PMID:26517172

  17. A software tool for STED-AFM correlative super-resolution microscopy

    NASA Astrophysics Data System (ADS)

    Koho, Sami; Deguchi, Takahiro; Löhmus, Madis; Näreoja, Tuomas; Hänninen, Pekka E.

    2015-03-01

    Multi-modal correlative microscopy allows combining the strengths of several imaging techniques to provide unique contrast. However it is not always straightforward to setup instruments for such customized experiments, as most microscope manufacturers use their own proprietary software, with limited or no capability to interface with other instruments - this makes correlation of the multi-modal data extremely challenging. We introduce a new software tool for simultaneous use of a STimulated Emission Depletion (STED) microscope with an Atomic Force Microscope (AFM). In our experiments, a Leica TCS STED commercial super-resolution microscope, together with an Agilent 5500ilm AFM microscope was used. With our software, it is possible to synchronize the data acquisition between the STED and AFM instruments, as well as to perform automatic registration of the AFM images with the super-resolution STED images. The software was realized in LabVIEW; the registration part was also implemented as an ImageJ script. The synchronization was realized by controlling simple trigger signals, also available in the commercial STED microscope, with a low-cost National Instruments USB-6501 digital I/O card. The registration was based on detecting the positions of the AFM tip inside the STED fieldof-view, which were then used as registration landmarks. The registration should work on any STED and tip-scanning AFM microscope combination, at nanometer-scale precision. Our STED-AFM correlation method has been tested with a variety of nanoparticle and fixed cell samples. The software will be released under BSD open-source license.

  18. Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching method.

    PubMed

    Yan, Yongda; Geng, Yanquan; Hu, Zhenjiang; Zhao, Xuesen; Yu, Bowen; Zhang, Qi

    2014-01-01

    This letter presents a novel atomic force microscopy (AFM)-based nanomanufacturing method combining the tip scanning with the high-precision stage movement to fabricate nanochannels with ladder nanostructure at the bottom by continuous scanning with a fixed scan size. Different structures can be obtained according to the matching relation of the tip feeding velocity and the precision stage moving velocity. This relationship was first studied in detail to achieve nanochannels with different ladder nanostructures at the bottom. Machining experiments were then performed to fabricate nanochannels on an aluminum alloy surface to demonstrate the capability of this AFM-based fabrication method presented in this study. Results show that the feed value and the tip orientation in the removing action play important roles in this method which has a significant effect on the machined surfaces. Finally, the capacity of this method to fabricate a large-scale nanochannel was also demonstrated. This method has the potential to advance the existing AFM tip-based nanomanufacturing technique of the formation these complex structures by increasing the removal speed, simplifying the processing procedure and achieving the large-scale nanofabrication. PMID:24940171

  19. Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching method

    PubMed Central

    2014-01-01

    This letter presents a novel atomic force microscopy (AFM)-based nanomanufacturing method combining the tip scanning with the high-precision stage movement to fabricate nanochannels with ladder nanostructure at the bottom by continuous scanning with a fixed scan size. Different structures can be obtained according to the matching relation of the tip feeding velocity and the precision stage moving velocity. This relationship was first studied in detail to achieve nanochannels with different ladder nanostructures at the bottom. Machining experiments were then performed to fabricate nanochannels on an aluminum alloy surface to demonstrate the capability of this AFM-based fabrication method presented in this study. Results show that the feed value and the tip orientation in the removing action play important roles in this method which has a significant effect on the machined surfaces. Finally, the capacity of this method to fabricate a large-scale nanochannel was also demonstrated. This method has the potential to advance the existing AFM tip-based nanomanufacturing technique of the formation these complex structures by increasing the removal speed, simplifying the processing procedure and achieving the large-scale nanofabrication. PMID:24940171

  20. An advanced AFM sensor: its profile accuracy and low probe wear property for high aspect ratio patterns

    NASA Astrophysics Data System (ADS)

    Watanabe, Masahiro; Baba, Shuichi; Nakata, Toshihiko; Kurenuma, Toru; Kunitomo, Yuichi; Edamura, Manabu

    2007-03-01

    Design rule shrinkage and wider adoption of new device structures such as STI, copper damascene interconnects, and deep trench structures have made the need for in-line process monitoring of step heights and profiles of device structures more urgent. To monitor active device patterns, as opposed to test patterns as in OCD, AFM is the only non-destructive 3D monitoring tool. The barriers to using AFM in-line monitoring are its slow throughput and the accuracy degradation associated with probe tip wear and spike noise caused by unwanted oscillation on the steep slopes of high-aspect-ratio patterns. Our proprietary AFM scanning method, StepIn TM mode, is the method best suited to measuring high-aspect-ratio pattern profiles. Because the probe is not dragged on the sample surface as in conventional AFM, the profile trace fidelity across steep slopes is excellent. Because the probe does not oscillate and hit the sample at a high frequency, as in AC scanning mode, this mode is free from unwanted spurious noises on steep sample slopes and incurs extremely little probe tip wear. To take full advantage of the above properties, we have developed an AFM sensor that is optimized for in-line use and produces accurate profile data at high speeds and incurs little probe tip wear. The control scheme we have developed for the AFM sensor, which we call "Advanced StepIn TM", elaborately analyses the contact force signal, enabling efficient probe tip scanning and a low and stable contact force. With a developed AFM sensor that realizes this concept, we conducted an intensive evaluation on the effect of low and stable contact force scan. Probes with HDC (high density carbon) tips were used for the evaluation. The experiment proves that low contact force enhances the measured profile fidelity by preventing probe tip slip on steep slopes. Dynamics simulation of these phenomena was also conducted, and its results agreed well with the experimental results. The low contact force scan also

  1. Nanoscale Mapping of Dielectric Properties of Nanomaterials from Kilohertz to Megahertz Using Ultrasmall Cantilevers.

    PubMed

    Cadena, Maria J; Sung, Seung Hyun; Boudouris, Bryan W; Reifenberger, Ronald; Raman, Arvind

    2016-04-26

    Electrostatic force microscopy (EFM) is often used for nanoscale dielectric spectroscopy, the measurement of local dielectric properties of materials as a function of frequency. However, the frequency range of atomic force microscopy (AFM)-based dielectric spectroscopy has been limited to a few kilohertz by the resonance frequency and noise of soft microcantilevers used for this purpose. Here, we boost the frequency range of local dielectric spectroscopy by 3 orders of magnitude from a few kilohertz to a few megahertz by developing a technique that exploits the high resonance frequency and low thermal noise of ultrasmall cantilevers (USCs). We map the frequency response of the real and imaginary components of the capacitance gradient (∂C(ω)/∂z) by using second-harmonic EFM and a theoretical model, which relates cantilever dynamics to the complex dielectric constant. We demonstrate the method by mapping the nanoscale dielectric spectrum of polymer-based materials for organic electronic devices. Beyond offering a powerful extension to AFM-based dielectric spectroscopy, the approach also allows the identification of electrostatic excitation frequencies which affords high dielectric contrast on nanomaterials. PMID:26972782

  2. Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance

    NASA Astrophysics Data System (ADS)

    Arima, Eiji; Naitoh, Yoshitaka; Li, Yan Jun; Yoshimura, Satoru; Saito, Hitoshi; Nomura, Hikaru; Nakatani, Ryoichi; Sugawara, Yasuhiro

    2015-03-01

    In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.

  3. Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance.

    PubMed

    Arima, Eiji; Naitoh, Yoshitaka; Li, Yan Jun; Yoshimura, Satoru; Saito, Hitoshi; Nomura, Hikaru; Nakatani, Ryoichi; Sugawara, Yasuhiro

    2015-03-27

    In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium. PMID:25736463

  4. Large deflections of a cantilever beam subjected to a follower force

    NASA Astrophysics Data System (ADS)

    Shvartsman, B. S.

    2007-07-01

    The large-deflection problem of a non-uniform spring-hinged cantilever beam under a tip-concentrated follower force is considered. The angle of inclination of the force with respect to the deformed axis of the beam remains unchanged during deformation. The mathematical formulation of this problem yields a nonlinear two-point boundary-value problem which is reduced to an initial-value problem by change of variables. The resulting problem can be solved without iterations. It is shown that there exist no critical loads in the Euler sense (divergence) for any flexural-stiffness distribution and angle of inclination of the follower force. The load-displacement characteristics of a uniform cantilever under a follower force normal to the deformed beam axis are presented.

  5. The complete process of large elastic-plastic deflection of a cantilever

    NASA Astrophysics Data System (ADS)

    Xiaoqiang, Wu; Tongxi, Yu

    1986-11-01

    An extension of the Elastica theory is developed to study the large deflection of an elastic-perfectly plastic horizontal cantilever beam subjected to a vertical concentrated force at its tip. The entire process is divided into four stages: I.elastic in the whole cantilever; II.loading and developing of the plastic region; III.unloading in the plastic region; and IV.reverse loading. Solutions for stages I and II are presented in a closed form. A combination of closed-form solution and numerical integration is presented for stage III. Finally, stage IV is qualitatively studied. Computed results are given and compared with those from small-deflection theory and from the Elastica theory.

  6. Dual-tip magnetic force microscopy with suppressed influence on magnetically soft samples.

    PubMed

    Precner, Marián; Fedor, Ján; Šoltýs, Ján; Cambel, Vladimír

    2015-02-01

    Standard magnetic force microscopy (MFM) is considered as a powerful tool used for magnetic field imaging at nanoscale. The method consists of two passes realized by the magnetic tip. Within the first one, the topography pass, the magnetic tip directly touches the magnetic sample. Such contact perturbs the magnetization of the sample explored. To avoid the sample touching the magnetic tip, we present a new approach to magnetic field scanning by segregating the topological and magnetic scans with two different tips located on a cut cantilever. The approach minimizes the disturbance of sample magnetization, which could be a major problem in conventional MFM images of soft magnetic samples. By cutting the cantilever in half using the focused ion beam technique, we create one sensor with two different tips--one tip is magnetized, and the other one is left non-magnetized. The non-magnetized tip is used for topography and the magnetized one for the magnetic field imaging. The method developed we call dual-tip magnetic force microscopy (DT-MFM). We describe in detail the dual-tip fabrication process. In the experiments, we show that the DT-MFM method reduces significantly the perturbations of the magnetic tip as compared to the standard MFM method. The present technique can be used to investigate microscopic magnetic domain structures in a variety of magnetic samples and is relevant in a wide range of applications, e.g., data storage and biomedicine. PMID:25586704

  7. AFM-based force microsensor for a microrobot

    NASA Astrophysics Data System (ADS)

    Fatikow, Sergej; Fahlbusch, Stephan

    2001-10-01

    Microrobots are the result of increasing research activities at the border between microsystem technology and robotics. Today already, robots with dimensions of a few cubic- centimeters can be developed. Like conventional robots, microrobots represent a complex system that usually contains several different types of actuators and sensors. The measurement of gripping forces is the most important sensor application in micromanipulation besides visual servoing to protect the parts from too high surface pressures and thereby damage during the assembly process. Very small forces in the range of 200 (mu) N down to 0.1 (mu) N or even less have to be sensed. Thus, the aim of our current research activities is the development of a high-resolution integrated force microsensor for measuring gripping forces in a microhandling robot. On the one hand, the sensor should be a device for teleoperated manipulation tasks in a flexible microhandling station. On the other hand, typical microhandling operations should to a large extend be automated with the aid of computer-based signal processing of sensor information. The user should be provided with an interface for teleoperated manipulation and an interface for partially automated manipulation of microobjects. In this paper, a concept for the measurement of gripping forces in microrobotics using piezoresistive AFM (atomic force microscope) cantilevers is introduced. Further on, the concept of a microrobot-based SEM station and its applications are presented.

  8. Four-beam model for vibration analysis of a cantilever beam with an embedded horizontal crack

    NASA Astrophysics Data System (ADS)

    Liu, Jing; Zhu, Weidong; Charalambides, Panos G.; Shao, Yimin; Xu, Yongfeng; Wu, Kai; Xiao, Huifang

    2016-01-01

    As one of the main failure modes, embedded cracks occur in beam structures due to periodic loads. Hence it is useful to investigate the dynamic characteristics of a beam structure with an embedded crack for early crack detection and diagnosis. A new four-beam model with local flexibilities at crack tips is developed to investigate the transverse vibration of a cantilever beam with an embedded horizontal crack; two separate beam segments are used to model the crack region to allow opening of crack surfaces. Each beam segment is considered as an Euler-Bernoulli beam. The governing equations and the matching and boundary conditions of the four-beam model are derived using Hamilton's principle. The natural frequencies and mode shapes of the four-beam model are calculated using the transfer matrix method. The effects of the crack length, depth, and location on the first three natural frequencies and mode shapes of the cracked cantilever beam are investigated. A continuous wavelet transform method is used to analyze the mode shapes of the cracked cantilever beam. It is shown that sudden changes in spatial variations of the wavelet coefficients of the mode shapes can be used to identify the length and location of an embedded horizontal crack. The first three natural frequencies and mode shapes of a cantilever beam with an embedded crack from the finite element method and an experimental investigation are used to validate the proposed model. Local deformations in the vicinity of the crack tips can be described by the proposed four-beam model, which cannot be captured by previous methods.

  9. Implementation of a four quadrant optic fibre bundle as a deflection sensor to get rid of heat sources in an AFM head

    NASA Astrophysics Data System (ADS)

    Boukellal, Younes; Ducourtieux, Sebastien

    2015-09-01

    In the frame of developing a thermally passive atomic force microscope head, a new kind of 2D displacement sensor based on a four quadrant optic fibre bundle has been implemented. The aim is to replace the quad cell photodiode used in the optical beam deflection method to detect cantilever deflection. The use of the bundle as a position sensor has already been modelled and experimentally evaluated in a previous work. This article reports on the implementation of the bundle as a deflection sensor for atomic force microscopy. The main motivation for such a development was to reduce the heat sources in the instrument. To reach this goal the photodiode and its conditioning circuit used for the measurement of cantilever deflection has been externalized from the AFM head. For the same reason, the laser diode and its electronic driver have been deported using optic fibre. To test the AFM head prototype in real conditions, approach curves and AFM images have been performed. The results show that the bundle is very well suited for AFM applications that require very low heat sources such as metrological AFM where each error source has to be managed.

  10. Torsion and transverse bending of cantilever plates

    NASA Technical Reports Server (NTRS)

    Reissner, Eric; Stein, Manuel

    1951-01-01

    The problem of combined bending and torsion of cantilever plates of variable thickness, such as might be considered for solid thin high-speed airplane or missile wings, is considered in this paper. The deflections of the plate are assumed to vary linearly across the chord; minimization of the potential energy by means of the calculus of variations then leads to two ordinary linear differential equations for the bending deflections and the twist of the plate. Because the cantilever is analyzed as a plate rather than as a beam, the effect of constraint against axial warping in torsion is inherently included. The application of this method to specific problems involving static deflection, vibration, and buckling of cantilever plates is presented. In the static-deflection problems, taper and sweep are considered.

  11. 2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING 168 (1960 HOG KILL) IS BENEATH HOG RUN - Rath Packing Company, Cantilevered Hog Run, Sycamore Street between Elm & Eighteenth Streets, Waterloo, Black Hawk County, IA

  12. An advanced AFM sensor for high-aspect ratio pattern profile in-line measurement

    NASA Astrophysics Data System (ADS)

    Watanabe, Masahiro; Baba, Shuichi; Nakata, Toshihiko; Kurenuma, Toru; Kuroda, Hiroshi; Hiroki, Takenori

    2006-03-01

    Design rule shrinkage and the wider adoption of new device structures such as STI, copper damascene interconnects, and deep trench structures have increased the necessity of in-line process monitoring of step heights and profiles of device structures. For monitoring active device patterns, not test patterns as in OCD, AFM is the only non-destructive 3D monitoring tool. The barriers to using AFM in-line monitoring are its slow throughput and the accuracy degradation associated with probe tip wear and spike noise caused by unwanted oscillation on the steep slopes of high-aspect-ratio patterns. Our proprietary AFM scanning method, Step in mode®, is the method best suited to measuring high-aspect-ratio pattern profiles. Because the probe is not dragged on the sample surface as in conventional AFM, the profile trace fidelity across steep slopes is excellent. Because the probe does not oscillate and hit the sample at a high frequency as in AC scanning mode, this mode is free from unwanted spurious noises on steep sample slopes and incurs extremely little probe tip wear. To fully take advantage of the above properties, we have developed an AFM sensor optimized for in-line use, which produces accurate profile data at high speeds. The control scheme we have developed for the AFM sensor, which we call "Smart Step-in", elaborately analyses the contact force signal, enabling efficient probe tip scanning and a low and stable contact force. The mechanism of the AFM sensor has been optimized for the higher scanning rate and has improved the accuracy, such as the scanning planarity, position and height accuracy, and slope angle accuracy. Our prototype AFM sensor can scan high-aspect-ratio patterns while stabilizing the contact force at 3 nN. The step height measurement repeatability was 0.8 nm (3σ). A STI-like test pattern was scanned, and the steep sidewalls with angles of 84° were measured with high fidelity and without spurious noises.

  13. Modeling bicortical screws under a cantilever bending load.

    PubMed

    James, Thomas P; Andrade, Brendan A

    2013-12-01

    Cyclic loading of surgical plating constructs can precipitate bone screw failure. As the frictional contact between the plate and the bone is lost, cantilever bending loads are transferred from the plate to the head of the screw, which over time causes fatigue fracture from cyclic bending. In this research, analytical models using beam mechanics theory were developed to describe the elastic deflection of a bicortical screw under a statically applied load. Four analytical models were developed to simulate the various restraint conditions applicable to bicortical support of the screw. In three of the models, the cortical bone near the tip of the screw was simulated by classical beam constraints (1) simply supported, (2) cantilever, and (3) split distributed load. In the final analytical model, the cortices were treated as an elastic foundation, whereby the response of the constraint was proportional to screw deflection. To test the predictive ability of the new analytical models, 3.5 mm cortical bone screws were tested in a synthetic bone substitute. A novel instrument was developed to measure the bending deflection of screws under radial loads (225 N, 445 N, and 670 N) applied by a surrogate surgical plate at the head of the screw. Of the four cases considered, the analytical model utilizing an elastic foundation most accurately predicted deflection at the screw head, with an average difference of 19% between the measured and predicted results. Determination of the bending moments from the elastic foundation model revealed that a maximum moment of 2.3 N m occurred near the middle of the cortical wall closest to the plate. The location of the maximum bending moment along the screw axis was consistent with the fracture location commonly observed in clinical practice. PMID:24105350

  14. Cantilever and capacitor technique for measuring dilatation

    SciTech Connect

    Primak, W.; Monahan, E.

    1983-05-01

    The relationship of EerNisse's technique for measuring small dilatations caused by irradiation with short-range particles, which utilizes a metallized thin plate mounted as a cantilever below whose free end an electrode is placed (forming a capacitor), to a photoelastic technique and to an interferometric technique are derived. The effects of stray capacitance, the fringing field of the capacitor, the clamping stress on the cantilever plate, the electrical resistance of the metallic coating, the charging of the tank circuit of which the capacitor is an element, the flange bolting stress, and the beam heating are assessed, and examples of the manner in which they contaminate the data are given.

  15. Self-heating in piezoresistive cantilevers

    PubMed Central

    Doll, Joseph C.; Corbin, Elise A.; King, William P.; Pruitt, Beth L.

    2011-01-01

    We report experiments and models of self-heating in piezoresistive microcantilevers that show how cantilever measurement resolution depends on the thermal properties of the surrounding fluid. The predicted cantilever temperature rise from a finite difference model is compared with detailed temperature measurements on fabricated devices. Increasing the fluid thermal conductivity allows for lower temperature operation for a given power dissipation, leading to lower force and displacement noise. The force noise in air is 76% greater than in water for the same increase in piezoresistor temperature. PMID:21731884

  16. Physics-based signal processing algorithms for micromachined cantilever arrays

    DOEpatents

    Candy, James V; Clague, David S; Lee, Christopher L; Rudd, Robert E; Burnham, Alan K; Tringe, Joseph W

    2013-11-19

    A method of using physics-based signal processing algorithms for micromachined cantilever arrays. The methods utilize deflection of a micromachined cantilever that represents the chemical, biological, or physical element being detected. One embodiment of the method comprises the steps of modeling the deflection of the micromachined cantilever producing a deflection model, sensing the deflection of the micromachined cantilever and producing a signal representing the deflection, and comparing the signal representing the deflection with the deflection model.

  17. Controlled AFM detachments and movement of nanoparticles: gold clusters on HOPG at different temperatures

    NASA Astrophysics Data System (ADS)

    Tripathi, Manoj; Paolicelli, Guido; D'Addato, Sergio; Valeri, Sergio

    2012-06-01

    The effect of temperature on the onset of movement of gold nanoclusters (diameter 27 nm) deposited on highly oriented pyrolytic graphite (HOPG) has been studied by atomic force microscopy (AFM) techniques. Using the AFM with amplitude modulation (tapping mode AFM) we have stimulated and controlled the movement of individual clusters. We show how, at room temperature, controlled detachments and smooth movements can be obtained for clusters having dimensions comparable to or smaller than the tip radius. Displacement is practically visible in real time and it can be started and stopped easily by adjusting only one parameter, the tip amplitude oscillation. Analysing the energy dissipation signal at the onset of nanocluster sliding we evaluated a detachment threshold energy as a function of temperature in the range 300-413 K. We also analysed single cluster thermal induced displacement and combining this delicate procedure with AFM forced movement behaviour we conclude that detachment threshold energy is directly related to the activation energy of nanocluster diffusion and it scales linearly with temperature as expected for a single-particle thermally activated process.

  18. First-principles AFM image simulation with frozen density embedding theory

    NASA Astrophysics Data System (ADS)

    Sakai, Yuki; Lee, Alex J.; Chelikowsky, James R.

    We present efficient first-principles method of non-contact atomic force microscopy (nc-AFM). Ordinary nc-AFM simulations based on density functional theory (DFT) require exhaustive computational cost because it involves thousands of total energy calculations. Regarding the sample as a fixed external potential can reduce the computational cost, and we adopt frozen density embedding theory (FDET) for this purpose. Simulated nc-AFM images with FDET using a carbon monoxide tip well reproduces the full DFT images of benzene, pentacene, and graphene, although optimized tip-sample distances and interaction energies in FDET are underestimated and overestimated, respectively. The FDET-based simulation method is promising for AFM image simulation of surfaces and two-dimensional materials. This work was supported by U.S. DOE under Grant No. DE-FG02-06ER46286 and Award No. DE-SC0008877, and by Welch Foundation under Grant F-1837. Computational resources are provided by NERSC and TACC.

  19. Applications of AFM for atomic manipulation and spectroscopy

    NASA Astrophysics Data System (ADS)

    Custance, Oscar

    2009-03-01

    Since the first demonstration of atom-by-atom assembly [1], atomic manipulation with scanning tunneling microscopy has yielded stunning realizations in nanoscience. A new exciting panorama has been recently opened with the possibility of manipulating atoms at surfaces using atomic force microscopy (AFM) [2-5]. In this talk, we will present two different approaches that enable patterning structures at semiconductor surfaces by manipulating individual atoms with AFM and at room temperature [2, 3]. We will discuss the physics behind each protocol through the analysis of the measured forces associated with these manipulations [3-5]. Another challenging issue in scanning probe microscopy is the ability to disclose the local chemical composition of a multi-element system at atomic level. Here, we will introduce a single-atom chemical identification method, which is based on detecting the forces between the outermost atom of the AFM tip and the atoms at a surface [6]. We demonstrate this identification procedure on a particularly challenging system, where any discrimination attempt based solely on topographic measurements would be impossible to achieve. [4pt] References: [0pt] [1] D. M. Eigler and E. K. Schweizer, Nature 344, 524 (1990); [0pt] [2] Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance and S. Morita, Nature Materials 4, 156 (2005); [0pt] [3] Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez and S. Morita, Science 322, 413 (2008); [0pt] [4] Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R. Perez and O. Custance, Phys. Rev. Lett. 98, 106104 (2007); [0pt] [5] M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl and A. J. Heinrich, Science 319, 1066 (2008); [0pt] [6] Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, and O. Custance, Nature 446, 64 (2007)

  20. Effect of Magnetic Film Thickness on the Spatial Resolution of Magnetic Force Microscope Tips

    NASA Astrophysics Data System (ADS)

    Nagano, Katsumasa; Tobari, Kousuke; Ohtake, Mitsuru; Futamoto, Masaaki

    2011-07-01

    Magnetic force microscope (MFM) tips were prepared by coating commercial atomic force microscope (AFM) tips of 5 nm radius with Co and CoCrPt magnetic thin films varying the thickness in a range of 10-80 nm. The structural and the magnetic properties of coated magnetic thin films were investigated by scanning electron microscopy, AFM, X-ray diffraction, and vibrating sample magnetometry. The tip radius and the film surface roughness increase with increasing the film thickness. With increasing the film thickness, the MFM signal sensitivity increases, whereas the resolution decreases due to increase of tip radius. The MFM observation resolutions of 10 nm and 23 nm are obtained with the tips coated with 20-nm-thick Co and 40-nm-thick CoCrPt films, respectively. The MFM resolution is influenced by both the tip radius and the magnetic moment of coated material.

  1. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

    SciTech Connect

    Sader, John E.; Friend, James R.

    2015-05-15

    Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

  2. Thermoelastic Analysis of a Vibrating TiB/Ti Cantilever Beam Using Differential Thermography

    SciTech Connect

    Byrd, Larry; Wyen, Travis; Byrd, Alex

    2008-02-15

    Differential thermography has been used to detect the fluctuating temperatures due the thermoelastic effect for a number of years. This paper examines functionally graded TiB/Ti cantilever beams excited on an electromechanical shaker in fully reversed bending. Finite difference analysis of specimens was used to look at the effect of heat conduction, convection and the fundamental frequency on the surface temperature distribution and compared to experimental data. The thermoelastic effect was also used to detect cracking and the stress field at the tip of the fixture during fatigue.

  3. Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

    NASA Astrophysics Data System (ADS)

    Kim, Byung I.; Bonander, Jeremy R.; Rasmussen, Jared A.

    2011-05-01

    We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges.

  4. Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope.

    PubMed

    Kim, Byung I; Bonander, Jeremy R; Rasmussen, Jared A

    2011-05-01

    We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges. PMID:21639511

  5. Forced Vibrations of a Cantilever Beam

    ERIC Educational Resources Information Center

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-01-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is "downwards", i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping…

  6. Biomechanical load analysis of cantilevered implant systems.

    PubMed

    Osier, J F

    1991-01-01

    Historically, dental implants have been placed in areas where quality bone exists. The maxillary sinus areas and mandibular canal proximities have been avoided. From these placements, various cantilevered prosthetic applications have emerged. This analysis uses static engineering principles to define the loads (i.e., forces) placed upon the implants. These principles make use of Newton's first and third laws of mechanics by summing the forces and moments to zero. These summations then generate mathematical equations and their algebraic solutions. Three implant systems are analyzed. The first is a two-implant system. The second is a three-implant cross-arch stabilized system usually found in mandibular replacements of lower full dentures. The third is a five-implant system which is identical to the three-implant cantilevered system but which uses implants in the first molar area, thereby negating the cantilevered load magnification of the three-implant design. These analyses demonstrate that, in a cantilevered application, the implant closest to the point of load application (usually the most posterior implant) takes the largest compressive load. Implants opposite the load application (generally the anterior implant) are in tension. These loads on the implants are normally magnified over the biting force and can easily reach 2 1/2 to five times the biting load. PMID:1942131

  7. A low-cost AFM setup with an interferometer for undergraduates and secondary-school students

    NASA Astrophysics Data System (ADS)

    Bergmann, Antje; Feigl, Daniela; Kuhn, David; Schaupp, Manuel; Quast, Günter; Busch, Kurt; Eichner, Ludwig; Schumacher, Jens

    2013-07-01

    Atomic force microscopy (AFM) is an important tool in nanotechnology. This method makes it possible to observe nanoscopic surfaces beyond the resolution of light microscopy. In order to provide undergraduate and secondary-school students with insights into this world, we have developed a very robust low-cost AFM setup with a Fabry-Perot interferometer as a detecting device. This setup is designed to be operated almost completely manually and its simplicity gives access to a profound understanding of the working principle. Our AFM is operated in a constant height mode, i.e. the topography of the sample surface is represented directly by the deflection of the cantilever. Thus, the measuring procedure can be understood even by secondary-school students; furthermore, it is the method with the lowest cost, totalling not more than 10-15 k Euros. Nevertheless, we are able to examine a large variety of sample topographies such as CD and DVD surfaces, IC structures, blood cells, butterfly wings or moth eyes. Furthermore, force-distance curves can be recorded and the tensile moduli of some materials can be evaluated. We present our setup in detail and describe its working principles. In addition, we show various experiments which have already been performed by students.

  8. A Novel Dog-Bone Oscillating AFM Probe with Thermal Actuation and Piezoresistive Detection †

    PubMed Central

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-01-01

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments. PMID:25365463

  9. Direct and alignment-insensitive measurement of cantilever curvature

    SciTech Connect

    Hermans, Rodolfo I.; Aeppli, Gabriel; Bailey, Joe M.

    2013-07-15

    We analytically derive and experimentally demonstrate a method for the simultaneous measurement of deflection for large arrays of cantilevers. The Fresnel diffraction patterns of a cantilever independently reveal tilt, curvature, cubic, and higher order bending of the cantilever. It provides a calibrated absolute measurement of the polynomial coefficients describing the cantilever shape, without careful alignment and could be applied to several cantilevers simultaneously with no added complexity. We show that the method is easily implemented, works in both liquid media and in air, for a broad range of displacements and is especially suited to the requirements for multi-marker biosensors.

  10. Prom Health and Safety Tips

    MedlinePlus

    ... Healthy Occasions Autumn Tips Camping Tips Family Reunions Gardening Tips Halloween Tips Healthy Halloween Prom Tips Spring ... ways to stay active, such as walking, dancing, gardening, swimming, and more. Be active for 60 minutes ...

  11. Nanoscopic polypyrrole AFM-SECM probes enabling force measurements under potential control

    NASA Astrophysics Data System (ADS)

    Knittel, P.; Higgins, M. J.; Kranz, C.

    2014-01-01

    Conductive polymers, and in particular polypyrrole, are frequently used as biomimetic interfaces facilitating growth and/or differentiation of cells and tissues. Hence, studying forces and local interactions between such polymer interfaces and cells at the nanoscale is of particular interest. Frequently, such force interactions are not directly accessible with high spatial resolution. Consequently, we have developed nanoscopic polypyrrole electrodes, which are integrated in AFM-SECM probes. Bifunctional AFM-SECM probes were modified via ion beam-induced deposition resulting in pyramidal conductive Pt-C composite electrodes. These nanoscopic electrodes then enabled localized polypyrrole deposition, thus resulting in polymer-modified AFM probes with a well-defined geometry. Furthermore, such probes may be reversibly switched from an insulating to a conductive state. In addition, the hydrophilicity of such polymer tips is dependent on the dopant, and hence, on the oxidation state. Force studies applying different tip potentials were performed at plasma-treated glass surfaces providing localized information on the associated force interactions, which are dependent on the applied potential and the dopant.Conductive polymers, and in particular polypyrrole, are frequently used as biomimetic interfaces facilitating growth and/or differentiation of cells and tissues. Hence, studying forces and local interactions between such polymer interfaces and cells at the nanoscale is of particular interest. Frequently, such force interactions are not directly accessible with high spatial resolution. Consequently, we have developed nanoscopic polypyrrole electrodes, which are integrated in AFM-SECM probes. Bifunctional AFM-SECM probes were modified via ion beam-induced deposition resulting in pyramidal conductive Pt-C composite electrodes. These nanoscopic electrodes then enabled localized polypyrrole deposition, thus resulting in polymer-modified AFM probes with a well

  12. Nano Mechanical Machining Using AFM Probe

    NASA Astrophysics Data System (ADS)

    Mostofa, Md. Golam

    Complex miniaturized components with high form accuracy will play key roles in the future development of many products, as they provide portability, disposability, lower material consumption in production, low power consumption during operation, lower sample requirements for testing, and higher heat transfer due to their very high surface-to-volume ratio. Given the high market demand for such micro and nano featured components, different manufacturing methods have been developed for their fabrication. Some of the common technologies in micro/nano fabrication are photolithography, electron beam lithography, X-ray lithography and other semiconductor processing techniques. Although these methods are capable of fabricating micro/nano structures with a resolution of less than a few nanometers, some of the shortcomings associated with these methods, such as high production costs for customized products, limited material choices, necessitate the development of other fabricating techniques. Micro/nano mechanical machining, such an atomic force microscope (AFM) probe based nano fabrication, has, therefore, been used to overcome some the major restrictions of the traditional processes. This technique removes material from the workpiece by engaging micro/nano size cutting tool (i.e. AFM probe) and is applicable on a wider range of materials compared to the photolithographic process. In spite of the unique benefits of nano mechanical machining, there are also some challenges with this technique, since the scale is reduced, such as size effects, burr formations, chip adhesions, fragility of tools and tool wear. Moreover, AFM based machining does not have any rotational movement, which makes fabrication of 3D features more difficult. Thus, vibration-assisted machining is introduced into AFM probe based nano mechanical machining to overcome the limitations associated with the conventional AFM probe based scratching method. Vibration-assisted machining reduced the cutting forces

  13. Application of a passive/active autoparametric cantilever beam absorber with PZT actuator for Duffing systems

    NASA Astrophysics Data System (ADS)

    Silva-Navarro, G.; Abundis-Fong, H. F.; Vazquez-Gonzalez, B.

    2013-04-01

    An experimental investigation is carried out on a cantilever-type passive/active autoparametric vibration absorber, with a PZT patch actuator, to be used in a primary damped Duffing system. The primary system consists of a mass, viscous damping and a cubic stiffness provided by a soft helical spring, over which is mounted a cantilever beam with a PZT patch actuator actively controlled to attenuate harmonic and resonant excitation forces. With the PZT actuator on the cantilever beam absorber, cemented to the base of the beam, the auto-parametric vibration absorber is made active, thus enabling the possibility to control the effective stiffness and damping associated to the passive absorber and, as a consequence, the implementation of an active vibration control scheme able to preserve, as possible, the autoparametric interaction as well as to compensate varying excitation frequencies and parametric uncertainty. This active vibration absorber employs feedback information from a high resolution optical encoder on the primary Duffing system and an accelerometer on the tip beam absorber, a strain gage on the base of the beam, feedforward information from the excitation force and on-line computations from the nonlinear approximate frequency response, parameterized in terms of a proportional gain provided by a voltage input to the PZT actuator, thus modifying the closed-loop dynamic stiffness and providing a mechanism to asymptotically track an optimal, robust and stable attenuation solution on the primary Duffing system. Experimental results are included to describe the dynamic and robust performance of the overall closed-loop system.

  14. Internal resonance in forced vibration of coupled cantilevers subjected to magnetic interaction

    NASA Astrophysics Data System (ADS)

    Chen, Li-Qun; Zhang, Guo-Ce; Ding, Hu

    2015-10-01

    Forced vibration is investigated for two elastically connected cantilevers, under harmonic base excitation. One of the cantilevers is with a tip magnet repelled by a magnet fixed on the base. The cantilevers are uniform viscoelastic beams constituted by the Kelvin model. The system is formulated as a set of two linear partial differential equations with nonlinear boundary conditions. The method of multiple scales is developed to analyze the effects of internal resonances on the steady-state responses to external excitations in the nonlinear boundary problem of the partial differential equations. In the presence of 2:1 internal resonance, both the first and the second primary resonances are examined in detail. The analytical frequency-amplitude response relationships are derived from the solvability conditions. It is found that the frequency-amplitude response curves reveal typical nonlinear phenomena such as jumping and hysteresis in both primary resonances as well as saturation in the second primary resonance. The frequency-amplitude response curves may be converted from hardening-type single-jumping to double-jumpings, and further to softening-type single-jumping by adjusting the distance between two magnets. It is also found that the unstable parts of the frequency-amplitude response curves correspond to quasi-periodic motions. The finite difference scheme is proposed to discretize both the temporal and the spatial variables, and thus the numerical solutions can be calculated. The analytical results are supported by the numerical solutions.

  15. Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM

    NASA Astrophysics Data System (ADS)

    Zandiatashbar, Ardavan; Taylor, Patrick A.; Kim, Byong; Yoo, Young-kook; Lee, Keibock; Jo, Ahjin; Lee, Ju Suk; Cho, Sang-Joon; Park, Sang-il

    2016-03-01

    Single crystal silicon wafers are the fundamental elements of semiconductor manufacturing industry. The wafers produced by Czochralski (CZ) process are very high quality single crystalline materials with known defects that are formed during the crystal growth or modified by further processing. While defects can be unfavorable for yield for some manufactured electrical devices, a group of defects like oxide precipitates can have both positive and negative impacts on the final device. The spatial distribution of these defects may be found by scattering techniques. However, due to limitations of scattering (i.e. light wavelength), many crystal defects are either poorly classified or not detected. Therefore a high throughput and accurate characterization of their shape and dimension is essential for reviewing the defects and proper classification. While scanning electron microscopy (SEM) can provide high resolution twodimensional images, atomic force microscopy (AFM) is essential for obtaining three-dimensional information of the defects of interest (DOI) as it is known to provide the highest vertical resolution among all techniques [1]. However AFM's low throughput, limited tip life, and laborious efforts for locating the DOI have been the limitations of this technique for defect review for 300 mm wafers. To address these limitations of AFM, automatic defect review AFM has been introduced recently [2], and is utilized in this work for studying DOI on 300 mm silicon wafer. In this work, we carefully etched a 300 mm silicon wafer with a gaseous acid in a reducing atmosphere at a temperature and for a sufficient duration to decorate and grow the crystal defects to a size capable of being detected as light scattering defects [3]. The etched defects form a shallow structure and their distribution and relative size are inspected by laser light scattering (LLS). However, several groups of defects couldn't be properly sized by the LLS due to the very shallow depth and low

  16. Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

    NASA Astrophysics Data System (ADS)

    Eckert, Rolf; Freyland, J. Moritz; Gersen, Henkjan; Heinzelmann, Harry; Schürmann, Gregor; Noell, Wilfried; Staufer, Urs; de Rooij, Nico F.

    2000-12-01

    High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7±3.6 nm has been deduced from full width at half maximum values of single molecule images.

  17. Investigation of adhesion during operation of MEMS cantilevers

    NASA Astrophysics Data System (ADS)

    Ali, Shaikh M.; Phinney, Leslie M.

    2004-01-01

    Reliability of MEMS is a major concern for the commercialization of laboratory prototypes. Surface adhesion or stiction strongly affects the reliability of MEMS devices which have sliding or rubbing contacts. Determination of adhesion energies, adhesion forces, and pull-off forces are important for predicting stiction in MEMS. We present an experimental technique to estimate the pull-off forces for MEMS surfaces. Polysilicon microcantilevers were electrostatically actuated using gradually varying voltages. A hysteresis was observed in the voltage at which the tip of the cantilevers made and broke contact with the substrate. Pull-off forces were estimated from the hysteresis in the voltage values using a strain energy formulation. The pull-off forces for microcantilevers dried out of isopropyl alcohol and repaired using laser irradiation were estimated to be in the range of 45-121 nN. The role of adhered length, variable external loading, and actuating signal on in-use stiction is also investigated. From our experimental results, we demonstrate an empirical approach to predict in-use stiction of microcantilevers.

  18. Investigation of adhesion during operation of MEMS cantilevers

    NASA Astrophysics Data System (ADS)

    Ali, Shaikh M.; Phinney, Leslie M.

    2003-12-01

    Reliability of MEMS is a major concern for the commercialization of laboratory prototypes. Surface adhesion or stiction strongly affects the reliability of MEMS devices which have sliding or rubbing contacts. Determination of adhesion energies, adhesion forces, and pull-off forces are important for predicting stiction in MEMS. We present an experimental technique to estimate the pull-off forces for MEMS surfaces. Polysilicon microcantilevers were electrostatically actuated using gradually varying voltages. A hysteresis was observed in the voltage at which the tip of the cantilevers made and broke contact with the substrate. Pull-off forces were estimated from the hysteresis in the voltage values using a strain energy formulation. The pull-off forces for microcantilevers dried out of isopropyl alcohol and repaired using laser irradiation were estimated to be in the range of 45-121 nN. The role of adhered length, variable external loading, and actuating signal on in-use stiction is also investigated. From our experimental results, we demonstrate an empirical approach to predict in-use stiction of microcantilevers.

  19. Micromachined silicon cantilever beam accelerometer incorporating an integrated optical waveguide

    NASA Technical Reports Server (NTRS)

    Burcham, Kevin E.; De Brabander, Gregory N.; Boyd, Joseph T.

    1993-01-01

    A micromachined cantilever beam accelerometer is described in which beam deflection is determined optically. A diving board structure is anisotropically etched into a silicon wafer. This diving board structure is patterned from the wafer backside so as to leave a small gap between the tip of the diving board and the opposite fixed edge on the front side of the wafer. In order to sense a realistic range of accelerations, a foot mass incorporated onto the end of the beam is found to provide design flexibility. A silicon nitride optical waveguide is then deposited by low pressure chemical vapor deposition (LPCVD) onto the sample. Beam deflection is measured by the decrease of light coupled across the gap between the waveguide sections. In order to investigate sensor response and simulate deflection of the beam, we utilized a separate beam and waveguide section which could be displaced from one another in a precisely controlled manner. Measurements were performed on samples with gaps of 4.0, 6.0, and 8.0 micron and the variation of the fraction of light coupled across the gap as a function of displacement and gap spacing was found to agree with overlap integral calculations.

  20. Interaction of a vortex dipole with a deformable cantilevered plate

    NASA Astrophysics Data System (ADS)

    Zivkov, Eugene; Yarusevych, Serhiy; Peterson, Sean

    2014-11-01

    The coupled interaction of a vortex dipole impacting the tip of a deformable cantilevered plate is investigated both numerically and experimentally. Numerically, a strongly coupled fluid-structure interaction code is used to simulate the impact at three dipole Reynolds numbers, Re = 500, 1500, and 3000. These Reynolds numbers are representative of flows over small-scale energy harvesting devices, and the plate properties model an ionic polymer-metal composite. Of particular interest is the vortex dynamics and the attendant plate response, with the underlying implications to energy harvesting. As the dipole approaches the plate, secondary vortical structures are generated at the plate, with finer structures present at higher Reynolds number. The dipole breaks up after the initial impact, which is followed by complex vortex interactions of secondary structures. The initial impact produces the largest plate deflection, followed by a more complex response attributed to plate interaction with multiple secondary vortices. The plate response to the initial impact is not strongly dependent upon the Reynolds number. However, the secondary vortex dynamics, and the associated plate loadings, exhibit strong Reynolds number dependence. To validate the numerical results, a similar dipole-plate interaction is modelled experimentally and characterized using flow visualization and time resolved, planar particle image velocimetry.

  1. Dimensions and the profile of surface nanobubbles: tip-nanobubble interactions and nanobubble deformation in atomic force microscopy.

    PubMed

    Walczyk, Wiktoria; Schönherr, Holger

    2014-10-14

    The interactions between argon surface nanobubbles and AFM tips on HOPG (highly oriented pyrolitic graphite) in water and the concomitant nanobubble deformation were analyzed as a function of position on the nanobubbles in a combined tapping mode and force-volume mode AFM study with hydrophilic and hydrophobic AFM tips. On the basis of the detailed analysis of force-distance curves acquired on the bubbles, we found that for hydrophobic tips the bubble interface may jump toward the tip and that the tip-bubble interaction strength and the magnitude of the bubble deformation were functions of vertical and horizontal position of the tip on the bubble and depended on the bubble size and tip size and functionality. The spatial variation is attributed to long-range attractive forces originating from the substrate under the bubbles, which dominate the interaction at the bubble rim. The nonuniform bubble deformation leads to a nonuniform underestimation of the bubble height, width, and contact angle in conventional AFM height data. In particular, scanning with a hydrophobic tip resulted in severe bubble deformation and distorted information in the AFM height image. For a typical nanobubble, the upward deformation may extend up to tens of nanometers above the unperturbed bubble height, and the lateral deformation may constitute 20% of the bubble width. Therefore, only scanning with a hydrophilic tip and no direct contact between the tip and the bubble may reduce nanobubble deformation and provide reliable AFM images that can be used to estimate adequately the unperturbed nanobubble dimensions. The deformation of the bubble shape and underestimation of the bubble size lead to the conclusion that the profile of surface nanobubbles is much closer than previously thought to a nearly flat bubble profile and hence that the Laplace pressure is much closer to the atmospheric pressure. Together with line pinning, this may explain the long nanobubble lifetimes observed previously. The

  2. Nasal Tip Deficiency.

    PubMed

    Cerkes, Nazim

    2016-01-01

    Nasal tip deficiency can be congenital or secondary to previous nasal surgeries. Underdeveloped medial crura usually present with underprojected tip and lack of tip definition. Weakness or malposition of lateral crura causes alar rim retraction and lateral nasal wall weakness. Structural grafting of alar cartilages strengthens the tip framework, reinforces the disrupted support mechanisms, and controls the position of the nasal tip. In secondary cases, anatomic reconstruction of the weakened or interrupted alar cartilages and reconstitution of a stable nasal tip tripod must be the goal for a predictable outcome. PMID:26616702

  3. The cantilever fixed partial denture--a literature review.

    PubMed

    Himmel, R; Pilo, R; Assif, D; Aviv, I

    1992-04-01

    The cantilever fixed partial denture (FPD) is a restoration with one or more abutments at one end and unsupported at the other end. Forces transmitted through the cantilevered pontics can cause tilting and rotational movements of the abutments. In a cross-arch unilateral cantilever FPD, the distal cantilevered unit is subjected to comparatively less force than the contralateral posterior abutment. The unilateral lack of terminal abutments causes lateral bending forces activate peripheral inhibitory feedback reactions from the periodontal and/or temporomandibular mechanoreceptors. The greatest strain in distal cantilevered FPDs is recorded mesial to the most distal retainer because most fractures occur in this location. To improve the prognosis of the FPD cantilever, the number of abutments should be increased and the number of pontics decreased. The abutment teeth need long roots and acceptable alveolar support. Prepared abutments require adequate length and parallel axial walls. An equilibrated and harmonious occlusion is necessary, as well as exemplary oral hygiene. A cantilevered FPD with adequate periodontal support can replace any tooth in the dental arch, but is especially useful as an alternative to a removable partial denture. The cantilevered FPD requires at least two abutment teeth. The only documented exception permitting a single abutment is the replacement of a maxillary lateral incisor with the canine as an abutment. An alternative to the cantilevered FPD is the osseointegrated implant. As osseointegrated implants become more popular, the need for the tooth-supported cantilevered FPD may decline, but it will remain an alternative treatment modality. PMID:1507130

  4. Single layer and multilayer tip coatings in magnetic force microscopy

    NASA Astrophysics Data System (ADS)

    Casey, S. M.; Lord, D. G.; Grundy, P. J.; Slade, M.; Lambrick, D.

    1999-04-01

    Interactions between the imaging tip and the sample in magnetic force microscopy (MFM) have been investigated by studying the magnetic microstructure of a range of epitaxial garnet films. Etched silicon cantilever probes, coated with CoPt alloy films and Co/Pt multilayers, provided a range of MFM probes for this study. Resonant torque magnetometry was used to characterize their magnetic properties. Phase change images were found to vary considerably in terms of relative "domain volumes" at the surface depending on which probe was used. Decreasing the moment of the alloy coated tips by using thinner layers reduces the "magnetizing" interaction of the tip field but also reduced the signal to noise ratio. By coating the tip with a multilayer a good signal to noise ratio could be obtained with very little interaction. Force-distance curves were used to study the response of the tips at various lift heights. The tips coated with alloy films gave a significant decrease in signal to noise ratio as the lift height increased whereas the multilayer tips maintained a signal which varied little with lift height.

  5. Linear and Nonlinear Photoinduced Deformations of Cantilevers

    NASA Astrophysics Data System (ADS)

    Corbett, D.; Warner, M.

    2007-10-01

    Glassy and elastomeric nematic networks with dye molecules present can be very responsive to illumination, huge reversible strains being possible. If absorption is appreciable, strain decreases with depth into a cantilever, leading to bend that is the basis of micro-opto-mechanical systems (MOMS). Bend actually occurs even when Beer’s law suggests a tiny penetration of light into a heavily dye-doped system. We model the nonlinear opto-elastic processes behind this effect. In the regime of cantilever thickness giving optimal bending for a given incident light intensity, there are three neutral surfaces. In practice such nonlinear absorptive effects are very important since heavily doped systems are commonly used.

  6. Cantilever mounted resilient pad gas bearing

    NASA Technical Reports Server (NTRS)

    Etsion, I. (Inventor)

    1978-01-01

    A gas-lubricated bearing is described, employing at least one pad mounted on a rectangular cantilever beam to produce a lubricating wedge between the face of the pad and a moving surface. The load-carrying and stiffness characteristics of the pad are related to the dimensions and modulus of elasticity of the beam. The bearing is applicable to a wide variety of types of hydrodynamic bearings.

  7. Tip-sample interaction in tapping-mode scanning force microscopy

    NASA Astrophysics Data System (ADS)

    de Pablo, P. J.; Colchero, J.; Luna, M.; Gómez-Herrero, J.; Baró, A. M.

    2000-05-01

    Tip-sample interaction in intermittent contact scanning force microscopy, also called tapping mode, is experimentally studied to determine under which conditions tip-sample contact is established. Force vs distance curves are made while the cantilever is oscillating at its resonance frequency. Cantilevers with different force constants driven at different oscillation amplitudes have been used. In addition, samples with different hardness, such as silicon oxide, glass, and highly orientated pyrolytic graphite were taken as sample surface. From the analysis of the data we conclude that by choosing appropriate operating conditions, tip-sample contact can be avoided. This operating regime is of general interest in scanning force microscopy, since it allows imaging of even the softest samples.

  8. Hydration states of AFm cement phases

    SciTech Connect

    Baquerizo, Luis G.; Matschei, Thomas; Scrivener, Karen L.; Saeidpour, Mahsa; Wadsö, Lars

    2015-07-15

    The AFm phase, one of the main products formed during the hydration of Portland and calcium aluminate cement based systems, belongs to the layered double hydrate (LDH) family having positively charged layers and water plus charge-balancing anions in the interlayer. It is known that these phases present different hydration states (i.e. varying water content) depending on the relative humidity (RH), temperature and anion type, which might be linked to volume changes (swelling and shrinkage). Unfortunately the stability conditions of these phases are insufficiently reported. This paper presents novel experimental results on the different hydration states of the most important AFm phases: monocarboaluminate, hemicarboaluminate, strätlingite, hydroxy-AFm and monosulfoaluminate, and the thermodynamic properties associated with changes in their water content during absorption/desorption. This data opens the possibility to model the response of cementitious systems during drying and wetting and to engineer systems more resistant to harsh external conditions.

  9. AFM indentation study of breast cancer cells

    SciTech Connect

    Li, Q.S.; Lee, G.Y.H.; Ong, C.N.; Lim, C.T.

    2008-10-03

    Mechanical properties of individual living cells are known to be closely related to the health and function of the human body. Here, atomic force microscopy (AFM) indentation using a micro-sized spherical probe was carried out to characterize the elasticity of benign (MCF-10A) and cancerous (MCF-7) human breast epithelial cells. AFM imaging and confocal fluorescence imaging were also used to investigate their corresponding sub-membrane cytoskeletal structures. Malignant (MCF-7) breast cells were found to have an apparent Young's modulus significantly lower (1.4-1.8 times) than that of their non-malignant (MCF-10A) counterparts at physiological temperature (37 deg. C), and their apparent Young's modulus increase with loading rate. Both confocal and AFM images showed a significant difference in the organization of their sub-membrane actin structures which directly contribute to their difference in cell elasticity. This change may have facilitated easy migration and invasion of malignant cells during metastasis.

  10. An energy harvester using piezoelectric cantilever beams undergoing coupled bending-torsion vibrations

    NASA Astrophysics Data System (ADS)

    Abdelkefi, A.; Najar, F.; Nayfeh, A. H.; Ben Ayed, S.

    2011-11-01

    Recently, piezoelectric cantilevered beams have received considerable attention for vibration-to-electric energy conversion. Generally, researchers have investigated a classical piezoelectric cantilever beam with or without a tip mass. In this paper, we propose the use of a unimorph cantilever beam undergoing bending-torsion vibrations as a new piezoelectric energy harvester. The proposed design consists of a single piezoelectric layer and a couple of asymmetric tip masses; the latter convert part of the base excitation force into a torsion moment. This structure can be tuned to be a broader band energy harvester by adjusting the first two global natural frequencies to be relatively close to each other. We develop a distributed-parameter model of the harvester by using the Euler-beam theory and Hamilton's principle, thereby obtaining the governing equations of motion and associated boundary conditions. Then, we calculate the exact eigenvalues and associated mode shapes and validate them with a finite element (FE) model. We use these mode shapes in a Galerkin procedure to develop a reduced-order model of the harvester, which we use in turn to obtain closed-form expressions for the displacement, twisting angle, voltage output, and harvested electrical power. These expressions are used to conduct a parametric study for the dynamics of the system to determine the appropriate set of geometric properties that maximizes the harvested electrical power. The results show that, as the asymmetry is increased, the harvester's performance improves. We found a 30% increase in the harvested power with this design compared to the case of beams undergoing bending only. We also show that the locations of the two masses can be chosen to bring the lowest two global natural frequencies closer to each other, thereby allowing the harvesting of electrical power from multi-frequency excitations.

  11. Single molecule force spectroscopy by AFM indicates helical structure of poly(ethylene-glycol) in water

    NASA Astrophysics Data System (ADS)

    Oesterhelt, F.; Rief, M.; Gaub, H. E.

    1999-03-01

    We elongated individual poly(ethylene-glycol) (PEG) molecules tethered at one end to an AFM cantilever. We observed the resistive force as a function of elongation in different solvents. In all cases the molecular response was found to be fully reversible and thus in thermodynamic equilibrium. In hexadecane the stretched PEG acts like an ideal entropy spring and can be well described as a freely jointed chain. In water we observed marked deviations in the transition region from entropic to enthalpic elasticity, indicating the deformation of a supra-structure within the polymer. An analysis based on elastically coupled Markovian two-level systems agrees well with recent ab initio calculations predicting that PEG in water forms a non-planar supra-structure which is stabilized by water bridges. We obtained a binding free energy of 3.0+/-0.3 kT.

  12. Analytical solutions to the free vibration of a double-walled carbon nanotube carrying a bacterium at its tip

    SciTech Connect

    Storch, Joel A.; Elishakoff, Isaac

    2013-11-07

    We calculate the natural frequencies and mode shapes of a cantilevered double-walled carbon nanotube carrying a rigid body—representative of a bacterium or virus—at the tip of the outer nanotube. By idealizing the nanotubes as Bernoulli-Euler beams, we are able to obtain exact expressions for both the mode shapes and characteristic frequency equation. Separate analyses are performed for the special case of a concentrated tip mass and the more complicated situation where the tip body also exhibits inertia and mass center offset from the beam tip.

  13. Tip Based Nanofabrication Using Multi-mode Scanning Probe Microscopy

    NASA Astrophysics Data System (ADS)

    Hu, Weihua

    Scanning probe microscopy (SPM) based nanotechnology is a promising technology in nano-device fabrication. It is able to both manipulate nanostructures and characterize the created nanopatterns using the nano-tip of the scanning probe on a mechanical basis or electrical basis. With the tip and device on similar scales, nano-tip based fabrication permits accurate control over the device geometry through tip manipulation with nanometer (or better) accuracy. However, SPM based nanofabrication is a slow process because the scanning velocity of the microscopy is low. Large, multi-tip arrays offer the possibility for parallel device fabrication, allowing mass fabrication with nanometer control. The goal of Tip-directed Field-emission Assisted Nanofabrication (TFAN) project was to realize parallel fabrication using our probe arrays. We started by fabricating nanodevice using one single probe. In this work, we investigated the study of fabricating single electron transistor (SET) using one single SPM probe. There were four stages we went through toward fabricating a SET. The first stage was to accomplish atomic-precision lithography in TFAN system. Atomic level lithography was achieved by desorbing hydrogen atoms, which were previously adsorbed to the Si(100)-2 × 1 surface, in ultrahigh vacuum scanning tunneling microscopy (UHV-STM). The second stage was to develop method for fabricating SET. SPM based local oxidation was chosen as the method to fabricate a SET on a thin titanium (Ti) film. A multi-mode SPM oxidation method was developed, in which both scanning tunneling microscopy (STM) mode and atomic microscopy (AFM) mode local oxidation were used to fabricated Ti-TiOx-Ti structures with the same conductive AFM probe. This multi-mode method enabled significantly fine feature size control by STM mode, working on insulating SiO2 substrates needed to isolate the device by AFM mode and in situ electrical characterization with conductive AFM mode. After developing the multi

  14. Flows with tip leakage

    NASA Astrophysics Data System (ADS)

    Moore, John

    The flow development within the tip gap and the flow tip leakage, applying Navier-Stokes codes, are discussed. The loss production, the turbine inefficiency and the heat transfer to the blade tip, are considered. The measurements and calculations used demonstrate features of the flow, such as separation and reattachment on the blade tip, shock formation in the tip gap, and formation and dissipation of tip gap secondary kinetic energy. A procedure for calculating turbine blade tip temperatures is included. The results for a centrifugal compressor show the interaction of the tip leakage and passage flows. The radial blackflow near the shroud wall at low off-design flow rates is considered. The calculations demonstrate the potential use of a computational fluid dynamics code for predicting a centrifugal compressor map.

  15. Diet and Exercise Tips

    MedlinePlus

    ... Health News & Publications Annual Meeting Calendar Diet and Exercise Tips Diet and Exercise Tips News media interested in covering the latest ... Health Statistics concludes that 35 percent of adults exercise regularly (more than 6 of 10 don’t), ...

  16. Slender tip laser scalpel

    DOEpatents

    Veligdan, James T.

    2004-01-06

    A laser scalpel includes a ribbon optical waveguide extending therethrough and terminating at a slender optical cutting tip. A laser beam is emitted along the height of the cutting tip for cutting tissue therealong.

  17. Computational local stiffness analysis of biological cell: High aspect ratio single wall carbon nanotube tip.

    PubMed

    TermehYousefi, Amin; Bagheri, Samira; Shahnazar, Sheida; Rahman, Md Habibur; Kadri, Nahrizul Adib

    2016-02-01

    Carbon nanotubes (CNTs) are potentially ideal tips for atomic force microscopy (AFM) due to the robust mechanical properties, nanoscale diameter and also their ability to be functionalized by chemical and biological components at the tip ends. This contribution develops the idea of using CNTs as an AFM tip in computational analysis of the biological cells. The proposed software was ABAQUS 6.13 CAE/CEL provided by Dassault Systems, which is a powerful finite element (FE) tool to perform the numerical analysis and visualize the interactions between proposed tip and membrane of the cell. Finite element analysis employed for each section and displacement of the nodes located in the contact area was monitored by using an output database (ODB). Mooney-Rivlin hyperelastic model of the cell allows the simulation to obtain a new method for estimating the stiffness and spring constant of the cell. Stress and strain curve indicates the yield stress point which defines as a vertical stress and plan stress. Spring constant of the cell and the local stiffness was measured as well as the applied force of CNT-AFM tip on the contact area of the cell. This reliable integration of CNT-AFM tip process provides a new class of high performance nanoprobes for single biological cell analysis. PMID:26652417

  18. 100 Tips for Parents.

    ERIC Educational Resources Information Center

    Department of Education, Washington, DC.

    Noting that involved parents can improve their children's chances of succeeding in school, this packet of cards offers 100 tips created to help parents become more involved in their child's education. Following a card of general tips on becoming involved, tips are offered in the following topic areas: helping a child stay alcohol, tobacco, and…

  19. Child Transportation Safety Tips.

    ERIC Educational Resources Information Center

    National Highway Traffic Safety Administration (DOT), Washington, DC.

    This document presents nine tips regarding safe infant and child transportation, each tip explained in one to two pages. The tips are as follows: (1) quick safety seat checkup; (2) where should your child ride? (3) how to protect your new baby in the car; (4) what safety seat to use for a big baby or toddler? (5) how should preschool and school…

  20. The crooked nasal tip.

    PubMed

    Warner, Jeremy; Adamson, Peter

    2011-10-01

    Successful treatment of the crooked nasal tip includes proper analysis and assessment, employment of the proper techniques, reaching ideal tip dynamics, and close follow-up. Both the caudal septum and the nasal tip cartilages must be addressed. When executed properly, satisfaction should be high for both the patient and the surgeon. PMID:22028009

  1. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system.

    PubMed

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-10

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films. PMID:27146083

  2. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system

    NASA Astrophysics Data System (ADS)

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-01

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films.

  3. Implications of the contact radius to line step (CRLS) ratio in AFM for nanotribology measurements.

    PubMed

    Helt, James M; Batteas, James D

    2006-07-01

    Investigating the mechanisms of defect generation and growth at surfaces on the nanometer scale typically requires high-resolution tools such as the atomic force microscope (AFM). To accurately assess the kinetics and activation parameters of defect production over a wide range of loads (F(z)), the AFM data should be properly conditioned. Generally, AFM wear trials are performed over an area defined by the length of the slow (L(sscan)) and fast scan axes. The ratio of L(sscan) to image resolution (res, lines per image) becomes an important experimental parameter in AFM wear trials because it defines the magnitude of the line step (LS = L(sscan)/res), the distance the AFM tip steps along the slow scan axis. Comparing the contact radius (a) to the line step (LS) indicates that the overlap of successive scans will result unless the contact radius-line step ratio (CRLS) is < or =(1)/(2). If this relationship is not considered, then the scan history (e.g., contact frequency) associated with a single scan is not equivalent at different loads owing to the scaling of contact radius with load (a proportional variant F(z)(1/3)). Here, we present a model in conjunction with empirical wear tests on muscovite mica to evaluate the effects of scan overlap on surface wear. Using the Hertz contact mechanics definition of a, the CRLS model shows that scan overlap pervades AFM wear trials even under low loads. Such findings indicate that simply counting the number of scans (N(scans)) in an experiment underestimates the full history conveyed to the surface by the tip and translates into an error in the actual extent to which a region on the surface is contacted. Utilizing the CRLS method described here provides an approach to account for image scan history accurately and to predict the extent of surface wear. This general model also has implications for any AFM measurement where one wishes to correlate scan-dependent history to image properties as well as feature resolution in scanned

  4. Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2×1)

    NASA Astrophysics Data System (ADS)

    Özgür Özer, H.; Atabak, Mehrdad; Oral, Ahmet

    2002-12-01

    Si(100)(2×1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.

  5. Current, charge, and capacitance during scanning probe oxidation of silicon. II. Electrostatic and meniscus forces acting on cantilever bending

    NASA Astrophysics Data System (ADS)

    Dagata, J. A.; Perez-Murano, F.; Martin, C.; Kuramochi, H.; Yokoyama, H.

    2004-08-01

    A comprehensive analysis of the electrical current passing through the tip-substrate junction during oxidation of silicon by scanning probe microscopy (SPM) is presented. This analysis identifies the electronic and ionic contributions to the total current, especially at the initial stages of the reaction, determines the effective contact area of the tip-substrate junction, and unifies the roles of space charge and meniscus formation. In this work, we concentrate on noncontact SPM oxidation. We analyze simultaneous force-distance and current-distance curves to demonstrate that total current flow during noncontact oxidation is significantly less for noncontact mode than for contact oxidation, although the resulting oxide volume is nearly identical. Ionization of water layers and mobile charge reorganization prior to and following meniscus formation is also shown to alter the tip-substrate capacitance and, therefore, the bending of the SPM cantilever.

  6. Conductance of AFM Deformed Carbon Nanotubes

    NASA Technical Reports Server (NTRS)

    Svizhenko, Alexei; Maiti, Amitesh; Anatram, M. P.; Biegel, Bryan (Technical Monitor)

    2002-01-01

    This viewgraph presentation provides information on the electrical conductivity of carbon nanotubes upon deformation by atomic force microscopy (AFM). The density of states and conductance were computed using four orbital tight-binding method with various parameterizations. Different chiralities develop bandgap that varies with chirality.

  7. Contact nanomechanical measurements with the AFM

    NASA Astrophysics Data System (ADS)

    Geisse, Nicholas

    2013-03-01

    The atomic force microscope (AFM) has found broad use in the biological sciences largely due to its ability to make measurements on unfixed and unstained samples under liquid. In addition to imaging at multiple spatial scales ranging from micro- to nanometer, AFMs are commonly used as nanomechanical probes. This is pertinent for cell biology, as it has been demonstrated that the geometrical and mechanical properties of the extracellular microenvironment are important in such processes as cancer, cardiovascular disease, muscular dystrophy, and even the control of cell life and death. Indeed, the ability to control and quantify these external geometrical and mechanical parameters arises as a key issue in the field. Because AFM can quantitatively measure the mechanical properties of various biological samples, novel insights to cell function and to cell-substrate interactions are now possible. As the application of AFM to these types of problems is widened, it is important to understand the performance envelope of the technique and its associated data analyses. This talk will discuss the important issues that must be considered when mechanical models are applied to real-world data. Examples of the effect of different model assumptions on our understanding of the measured material properties will be shown. Furthermore, specific examples of the importance of mechanical stimuli and the micromechanical environment to the structure and function of biological materials will be presented.

  8. Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

    PubMed Central

    Shaw, Gordon A

    2013-01-01

    Summary In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements. PMID:23400392

  9. Fracture Mechanics Testing of Titanium 6AL-4V in AF-M315E

    NASA Technical Reports Server (NTRS)

    Sampson, J. W.; Martinez, J.; McLean, C.

    2016-01-01

    The Green Propellant Infusion Mission (GPIM) will demonstrate the performance of AF-M315E monopropellant on orbit. Flight certification requires a safe-life analysis of the titanium alloy fuel tank to ensure inherent processing flaws will not cause failure during the design life of the tank. Material property inputs for this analysis require testing to determine the stress intensity factor for environment-assisted cracking (KEAC) of Ti 6Al-4V in combination with the AF-M315E monopropellant. Testing of single-edge notched, or SE(B), specimens representing the bulk tank membrane and weld material were performed in accordance with ASTM E1681. Specimens with fatigue pre-cracks were loaded into test fixtures so that the crack tips were exposed to AF-M315E at 50 C for a duration of 1,000 hours. Specimens that did not fail during exposure were opened to inspect the crack surfaces for evidence of crack growth. The threshold stress intensity value, KEAC, is the highest applied stress intensity that produced neither a failure of the specimen during the exposure nor showed evidence of crack growth. The threshold stress intensity factor for environment-assisted cracking of the Ti 6Al-4V forged tank material was found to be at least 22 ksivin and at least 31 ksivin for the weld material when exposed to AF-M315E monopropellant.

  10. Note: Mechanical etching of atomic force microscope tip and microsphere attachment for thermal radiation scattering enhancement

    NASA Astrophysics Data System (ADS)

    Brissinger, D.; Parent, G.; Lacroix, D.

    2013-12-01

    This Note describes a mechanical etching technique which can be used to prepare silicon tips used in atomic force microscopy apparatus. For such devices, dedicated tips with specific shapes are now commonly used to probe surfaces. Yet, the control of the tip morphology where characteristic scales are lower than 1 μm remains a real challenge. Here, we detail a controlled etching process of AFM probes apex allowing micrometer-sized sphere attachment. The technique used and influent parameters are discussed and SEM images of the achieved tips are given. Deceptive problems and drawbacks that might occur during the process are also covered.

  11. Arctic climate tipping points.

    PubMed

    Lenton, Timothy M

    2012-02-01

    There is widespread concern that anthropogenic global warming will trigger Arctic climate tipping points. The Arctic has a long history of natural, abrupt climate changes, which together with current observations and model projections, can help us to identify which parts of the Arctic climate system might pass future tipping points. Here the climate tipping points are defined, noting that not all of them involve bifurcations leading to irreversible change. Past abrupt climate changes in the Arctic are briefly reviewed. Then, the current behaviour of a range of Arctic systems is summarised. Looking ahead, a range of potential tipping phenomena are described. This leads to a revised and expanded list of potential Arctic climate tipping elements, whose likelihood is assessed, in terms of how much warming will be required to tip them. Finally, the available responses are considered, especially the prospects for avoiding Arctic climate tipping points. PMID:22270703

  12. Single stage evaluation of highly loaded high Mach number compressor stages. 6: Data and performance of cantilevered stator

    NASA Technical Reports Server (NTRS)

    Merrow, A. S.

    1972-01-01

    A compressor stage with a rotor tip speed of 1600 ft/sec was tested to evaluate its performance with a cantilevered stator and a rotating inner shroud beneath the stator. Both the rotor blades and the stator vanes were composed of multiple circular arc airfoil sections. Comparison of data taken during this test of the cantilevered stator and previous tests with the same compressor and airfoil geometry in a shroud stator configuration showed only slight differences in stage performance with no significant effect on overall efficiency. However, the severity of the stator wake near the rotating hub was decreased at all flows including the near surge condition. Stall and wise open discharge corrected weight flows were the same as for the shrouded stator configuration.

  13. Real-Time, Label-Free, All-Electrical Detection of Salmonella typhimurium Using Lead Zirconate Titanate/Gold-Coated Glass Cantilevers at any Relative Humidity

    PubMed Central

    Zhu, Qing; Shih, Wan Y.; Shih, Wei-Heng

    2007-01-01

    We have examined non-insulated PZT/gold-coated glass cantilevers for real-time, label-free detection of Salmonella t. by partial dipping at any relative humidity. The PZT/gold-coated glass cantilevers were consisted of a 0.127 mm thick PZT layer about 0.8 mm long, 2 mm wide bonded to a 0.15 mm thick gold-coated glass layer with a 3.0 mm long gold-coated glass tip for detection. We showed that by placing the water level at the nodal point, about 0.8 mm from the free end of the gold-glass tip, there was a 1-hr window in which the resonance frequency was stable despite the water level change by evaporation at 20% relative humidity or higher. By dipping the cantilevers to their nodal point, we were able to do real-time, label-free detection without background resonance frequency corrections at any relative humidity. The partially dipped PZT/gold-coated glass cantilever exhibited mass detection sensitivity, Δm/Δf = −5×10−11g/Hz, and a detection concentration sensitivity, 5×103 cells/ml in 2 ml of liquid, which was about two orders of magnitude lower than that of a 5 MHz QCM. It was also about two orders of magnitude lower than the infection dosage and one order of magnitude lower that the detection limit of a commercial Raptor sensor. PMID:22872784

  14. High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.

    PubMed

    Onishi, Keiko; Guo, Hongxuan; Nagano, Syoko; Fujita, Daisuke

    2014-11-01

    A Scanning Helium Ion Microscope (SHIM) is a high resolution surface observation instrument similar to a Scanning Electron Microscope (SEM) since both instruments employ finely focused particle beams of ions or electrons [1]. The apparent difference is that SHIMs can be used not only for a sub-nanometer scale resolution microscopic research, but also for the applications of very fine fabrication and direct lithography of surfaces at the nanoscale dimensions. On the other hand, atomic force microscope (AFM) is another type of high resolution microscopy which can measure a three-dimensional surface morphology by tracing a fine probe with a sharp tip apex on a specimen's surface.In order to measure highly uneven and concavo-convex surfaces by AFM, the probe of a high aspect ratio with a sharp tip is much more necessary than the probe of a general quadrangular pyramid shape. In this paper we report the manufacture of the probe tip of the high aspect ratio by ion-beam induced gas deposition using a nanoscale helium ion beam of SHIM.Gas of platinum organic compound was injected into the sample surface neighborhood in the vacuum chamber of SHIM. The decomposition of the gas and the precipitation of the involved metal brought up a platinum nano-object in a pillar shape on the normal commercial AFM probe tip. A SHIM system (Carl Zeiss, Orion Plus) equipped with the gas injection system (OmniProbe, OmniGIS) was used for the research. While the vacuum being kept to work, we injected platinum organic compound ((CH3)3(CH3C5H4)Pt) into the sample neighborhood and irradiated the helium ion beam with the shape of a point on the apex of the AFM probe tip. It is found that we can control the length of the Pt nano-pillar by irradiation time of the helium ion beam. The AFM probe which brought up a Pt nano-pillar is shown in Figure 1. It is revealed that a high-aspect-ratio Pt nano-pillar of ∼40nm diameter and up to ∼2000 nm length can be grown. In addition, for possible heating

  15. Dissipative particle dynamics simulation of a liquid meniscus confined between atomic force microscope tip and substrate

    NASA Astrophysics Data System (ADS)

    Li, Zhen; Lan, Chuanjin; Ma, Yanbao

    2012-11-01

    Liquid meniscus forms between the atomic force microscope (AFM) tip and the substrate under ambient humidity. The liquid meniscus affects the AFM measurements and plays an important role in dip-pen nanolithography. To understand the behaviors of the meniscus, a mesoscopic methodology called dissipative particle dynamics (DPD) is utilized to investigate the liquid meniscus confined between AFM tip and a solid surface. Results show that the structure of the liquid meniscus is highly dependent on the wettability properties of the tip and the substrate as well as the tip-to-surface distance. The area of liquid-solid interface increases as the wetting properties of the tip and substrate change from hydrophilic to hydrophobic, which results in a transition of the meniscus shape from convex to concave. The wetting properties of solid surface affect the process of the liquid meniscus breakup as the tip-to-surface distance increase. This nonlinear process is also affected by the surface tension of the liquid, thermal fluctuation and the speed of tip.

  16. Application of catalyst-free click reactions in attaching affinity molecules to tips of atomic force microscopy for detection of protein biomarkers.

    PubMed

    Senapati, Subhadip; Manna, Saikat; Lindsay, Stuart; Zhang, Peiming

    2013-11-26

    Atomic force microscopy (AFM) has been extensively used in studies of biological interactions. Particularly, AFM based force spectroscopy and recognition imaging can sense biomolecules on a single molecule level, having great potential to become a tool for molecular diagnostics in clinics. These techniques, however, require affinity molecules to be attached to AFM tips in order to specifically detect their targets. The attachment chemistry currently used on silicon tips involves multiple steps of reactions and moisture sensitive chemicals, such as (3-aminopropyl)triethoxysilane (APTES) and N-hydroxysuccinimide (NHS) ester, making the process difficult to operate in aqueous solutions. In the present study, we have developed a user-friendly protocol to functionalize the AFM tips with affinity molecules. A key feature of it is that all reactions are carried out in aqueous solutions. In summary, we first synthesized a molecular anchor composed of cyclooctyne and silatrane for introduction of a chemically reactive function to AFM tips and a bifunctional polyethylene glycol linker that harnesses two orthogonal click reactions, copper free alkyne-azide cycloaddition and thiol-vinylsulfone Michael addition, for attaching affinity molecules to AFM tips. The attachment chemistry was then validated by attaching antithrombin DNA aptamers and cyclo-RGD peptides to silicon nitride (SiN) tips, respectively, and measuring forces of unbinding these affinity molecules from their protein cognates human α-thrombin and human α5β1-integrin immobilized on mica surfaces. In turn, we used the same attachment chemistry to functionalize silicon tips with the same affinity molecules for AFM based recognition imaging, showing that the disease-relevant biomarkers such as α-thrombin and α5β1-integrin can be detected with high sensitivity and specificity by the single molecule technique. These studies demonstrate the feasibility of our attachment chemistry for the use in functionalization

  17. Application of Catalyst-free Click Reactions in Attaching Affinity Molecules to Tips of Atomic Force Microscopy for Detection of Protein Biomarkers

    PubMed Central

    Senapati, Subhadip; Manna, Saikat; Lindsay, Stuart; Zhang, Peiming

    2013-01-01

    Atomic Force Microscopy (AFM) has been extensively used in studies of biological interactions. Particularly, AFM based force spectroscopy and recognition imaging can sense biomolecules on a single molecule level, having great potential to become a tool for molecular diagnostics in clinics. These techniques, however, require affinity molecules to be attached to AFM tips in order to specifically detect their targets. The attachment chemistry currently used on silicon tips involves multiple steps of reactions and moisture sensitive chemicals, such as (3-aminopropyl)triethoxysilane (APTES) and N-hydroxysuccinimide (NHS) ester, making the process difficult to operate in aqueous solutions. In the present study, we have developed a user-friendly protocol to functionalize the AFM tips with affinity molecules. A key feature of it is that all reactions are carried out in aqueous solutions. In summary, we first synthesized a molecular anchor composed of cyclooctyne and silatrane for introduction of a chemically reactive function to AFM tips and a bi-functional polyethylene glycol linker that harnesses two orthogonal click reactions, copper free alkyne-azide cycloaddition and thiol-vinylsulfone Michael addition, for attaching affinity molecules to AFM tips. The attachment chemistry was then validated by attaching anti-thrombin DNA aptamers and cyclo-RGD peptides to silicon nitride (SiN) tips respectively, and measuring forces of unbinding these affinity molecules from their protein cognates human α-thrombin and human α5β1-integrin immobilized on mica surfaces. In turn, we used the same attachment chemistry to functionalize silicon tips with the same affinity molecules for AFM based recognition imaging, showing that the disease-relevant biomarkers such as α-thrombin and α5β1-integrin can be detected with high sensitivity and specificity by the single molecule technique. These studies demonstrate the feasibility of our attachment chemistry for the use in functionalization

  18. Adaptive AFM scan speed control for high aspect ratio fast structure tracking

    SciTech Connect

    Ahmad, Ahmad; Schuh, Andreas; Rangelow, Ivo W.

    2014-10-15

    Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is necessary to cover a large surface under investigation in reasonable times. Since AFMs are composed of mechanical components, they are associated with comparably low resonance frequencies that undermine the effort to increase the acquisition rates. In particular, high and steep structures are difficult to follow, which causes the cantilever to temporarily loose contact to or crash into the sample. Here, we report on a novel approach that does not affect the scanner dynamics, but adapts the lateral scanning speed of the scanner. The controller monitors the control error signal and, only when necessary, decreases the scan speed to allow the z-piezo more time to react to changes in the sample's topography. In this case, the overall imaging rate can be significantly increased, because a general scan speed trade-off decision is not needed and smooth areas are scanned fast. In contrast to methods trying to increase the z-piezo bandwidth, our method is a comparably simple approach that can be easily adapted to standard systems.

  19. Fast image scanning method in liquid-AFM without image distortion.

    PubMed

    Choi, Inhee; Kim, Younghun; Kim, Jong Ho; Yang, Young In; Lee, Jeongjin; Lee, Suseung; Hong, Surin; Yi, Jongheop

    2008-11-01

    High speed imaging by atomic force microscopy (AFM) allows one to directly observe the dynamic behavior of a sample surface immersed in liquid media; thus, it has been considered to be an indispensable tool for nanobiotechnology and is used in many research fields, including molecular biology and surface science. For real-time observation of a certain behavior, the high speed imaging technique should be accompanied with a high resolution imaging technique to identify target materials. To improve the image quality at a high scanning rate, we developed a variable-controlled fast scanning method, which originated from the modified squeeze-drag superposition model in liquid media. A collection of non-distorted images was accomplished after proper modification of the operating conditions in a viscous fluid, via the simple handling of loading force and cantilever length. Consequently, a speeded-up AFM imaging process was achieved in the liquid environment at up to 200 µm s(-1), without attachment of additional devices. The reliability of the proposed method was verified by the characterization of a grating sample immersed in three types of liquid media. In addition, the results were visualized for elastic biomolecules submerged in a liquid with high kinematic viscosity. PMID:21832743

  20. Comparison of the Identation and Elasticity of E.coli and its Spheroplasts by AFM

    SciTech Connect

    Sullivan, Claretta J; Venkataraman, Sankar; Retterer, Scott T; Allison, David P; Doktycz, Mitchel John

    2007-01-01

    Atomic force microscopy (AFM) provides a unique opportunity to study live individual bacteria at the nanometer scale. In addition to providing accurate morphological information, AFM can be exploited to investigate membrane protein localization and molecular interactions on the surface of living cells. A prerequisite for these studies is the development of robust procedures for sample preparation. While such procedures are established for intact bacteria, they are only beginning to emerge for bacterial spheroplasts. Spheroplasts are useful research models for studying mechanosensitive ion channels, membrane transport, lipopolysaccharide translocation, solute uptake, and the effects of antimicrobial agents on membranes. Furthermore, given the similarities between spheroplasts and cell wall-deficient (CWD) forms of pathogenic bacteria, spheroplast research could be relevant in biomedical research. In this paper, a new technique for immobilizing spheroplasts on mica pretreated with aminopropyltriethoxysilane (APTES) and glutaraldehyde is described. Using this mounting technique, the indentation and cell elasticity of glutaraldehyde-fixed and untreated spheroplasts of E. coli in liquid were measured. These values are compared to those of intact E. coli. Untreated spheroplasts were found to be much softer than the intact cells and the silicon nitride cantilevers used in this study.

  1. Molecular dynamics study on the mechanism of AFM-based nanoscratching process with water-layer lubrication

    NASA Astrophysics Data System (ADS)

    Ren, Jiaqi; Zhao, Jinsheng; Dong, Zeguang; Liu, Pinkuan

    2015-08-01

    The atomic force microscopy (AFM) based direct nanoscratching has been thoroughly studied but the mechanism of nanoscratching with water-layer lubrication is yet to be well understood. In current study, three-dimensional molecular dynamics (MD) simulations are conducted to evaluate the effects of the water-layer lubrication on the AFM-based nanoscratching process on monocrystalline copper. Comparisons of workpiece deformation, scratching forces, and friction coefficients are made between the water-lubricated and dry scratching under various thickness of water layer, scratching depth and scratching velocity. Simulation results reveal that the water layer has positive impact on the surface quality and significant influence on the scratching forces (normal forces and tangential forces). The friction coefficients of the tip in water-lubricated nanoscratching are significantly bigger than those in the dry process. Our simulation results shed lights on a promising AFM-based nanofabrication method, which can assist to get nanoscale surface morphologies with higher quality than traditional approaches.

  2. Improved assembly processes for the Quartz Digital Accelerometer cantilever

    SciTech Connect

    Romero, A.M.; Gebert, C.T.

    1990-07-01

    This report covers the development of improved assembly processes for the Quartz Digital Accelerometer cantilever. In this report we discuss improved single-assembly tooling, the development of tooling and processes for precision application of polyimide adhesive, the development of the wafer scale assembly procedure, and the application of eutectic bonding to cantilever assembly. 2 refs., 17 figs.

  3. Use of Cantilever Mechanics for Impacted Teeth: Case Series

    PubMed Central

    Paduano, Sergio; Spagnuolo, Gianrico; Franzese, Gerardo; Pellegrino, Gioacchino; Valletta, Rosa; Cioffi, Iacopo

    2013-01-01

    This paper describes the orthodontic treatment, and the biomechanics of cantilevers for the impaction of permanent teeth in youngs, adolescents, and adults. In these case series, multibracket straightwire fixed appliances, together with cantilever mechanics, were used to treat the impaired occlusion. PMID:24511332

  4. 11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD TOWARD NORTH PORTAL. Note vertical displacement in deck caused by partial collapse at point of connection between south cantilever arm and suspended span. - Smith River Bridge, CA State Highway 199 Spanning Smith River, Crescent City, Del Norte County, CA

  5. CLOSEUP VIEW OF BOTTOM OF MAIN BRIDGE CANTILEVER THROUGH TRUSS ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    CLOSE-UP VIEW OF BOTTOM OF MAIN BRIDGE CANTILEVER THROUGH TRUSS SPAN SHOWING CANTILEVERED HIGHWAY FLOOR BRACKET LOOKING NORTHWEST AT PIER “II”. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  6. Fiber-optic, cantilever-type acoustic motion velocity hydrophone.

    PubMed

    Cranch, G A; Miller, G A; Kirkendall, C K

    2012-07-01

    The interaction between fluid loaded fiber-optic cantilevers and a low frequency acoustic wave is investigated as the basis for an acoustic vector sensor. The displacements of the prototype cantilevers are measured with an integrated fiber laser strain sensor. A theoretical model predicting the frequency dependent shape of acoustically driven planar and cylindrical fiber-optic cantilevers incorporating effects of fluid viscosity is presented. The model demonstrates good agreement with the measured response of two prototype cantilevers, characterized with a vibrating water column, in the regime of Re ≥ 1. The performance of each cantilever geometry is also analyzed. Factors affecting the sensor performance such as fluid viscosity, laser mode profile, and support motion are considered. The planar cantilever is shown to experience the largest acoustically induced force and hence the highest acoustic responsivity. However, the cylindrical cantilever exhibits the smoothest response in water, due to the influence of viscous fluid damping, and is capable of two axis particle velocity measurement. These cantilevers are shown to be capable of achieving acoustic resolutions approaching the lowest sea-state ocean noise. PMID:22779459

  7. Hysteresis of the resonance frequency of magnetostrictive bending cantilevers

    NASA Astrophysics Data System (ADS)

    Löffler, Michael; Kremer, Ramona; Sutor, Alexander; Lerch, Reinhard

    2015-05-01

    Magnetostrictive bending cantilevers are applicable for wirelessly measuring physical quantities such as pressure and strain. Exploiting the ΔE-effect, the resonance frequency of the cantilevers is shifted because of a change in the magnetic biasing field. The biasing field, in turn, depends on the applied pressure or strain, respectively. With a view to the application as a reliable sensor, maximum sensitivity but minimum hysteresis in the biasing field/resonance frequency dependence is preferred. In this contribution, monomorph bending cantilevers fabricated using magnetostrictive Fe49Co49V2 and Metglas 2605SA1 are investigated regarding their applicability for future sensors. For this purpose, the biasing field-dependent polarization of the magnetostrictive materials and bending of the cantilevers are determined. Furthermore, a setup to magnetically bias the cantilevers and determine the bending resonance frequency is presented. Here, the resonance frequency is identified by measuring the impulse response employing a laser Doppler vibrometer. The measurement results reveal that cantilevers made of Fe49Co49V2 possess a distinct hysteretic behaviour at low magnetic biasing field magnitudes. This is ascribed to the polarization and bending hysteresis. Cantilevers fabricated using Metglas 2605SA1 feature a lower resonance frequency shift compared to cantilevers with Fe49Co49V2, which would result in a lower sensitivity of the sensor. However, their resonance frequency hysteresis is almost negligible.

  8. Resonating cantilever mass sensor with mechanical on-plane excitation

    NASA Astrophysics Data System (ADS)

    Teva, Jordi; Abadal, Gabriel; Jordà, Xavier; Borrise, Xavier; Davis, Zachary; Barniol, Nuria

    2003-04-01

    The aim of this paper is to report the experimental setup designed, developed and tested in order to achieve the first vibrating mode of a lateral cantilever with mechanical excitation. The on-plane oscillating cantilever is the basis of a proposed mass sensor with an expected resolution in the atto-gram scale. In a first system design, the cantilever is driven electrostatically by an electrode, which is placed parallel to the cantilever. The cantilever is driven to its first resonant mode applying an AC voltage between the cantilever and a driver. Also, a DC voltage is applied to increase the system response. The signal read-out of the transducer is the capacitive current of the cantilever-driver system. The mass sensor proposed, based on this cantilever-driver structure (CDS), is integrated with a CMOS circuitry in order to minimize the parasitic capacitances, that in this case take special relevance because of the low level output current coming from the transducer. Moreover, the electrostatic excitation introduces a parasitic current that overlaps the current due to the resonance. The mechanical excitation is an alternative excitation method which aim is to eliminate the excitation current. Here we describe the experimental facilities developed to achieve mechanical excitation and report preliminary results obtained by this excitation technique. The results are complemented with dynamic simulations of an equivalent system model that are in accordance with the experimental values.

  9. Geometric Characterization of Carbon Nanotubes by Atomic Force Microscopy in Conjunction with a Tip Characterizer

    NASA Astrophysics Data System (ADS)

    Wang, Chunmei; Itoh, Hiroshi; Homma, Yoshikazu; Sun, Jielin; Hu, Jun; Ichimura, Shingo

    2008-07-01

    An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations <1.5 nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.

  10. Enhancing local absorption within a gold nano-sphere on a dielectric surface under an AFM probe

    NASA Astrophysics Data System (ADS)

    Talebi Moghaddam, Sina; Ertürk, Hakan; Mengüç, M. Pınar

    2016-07-01

    This study considers enhancing localized absorption by a gold nanoparticle (NP) placed over a substrate where an atomic force microscope (AFM) tip is in close proximity of the particle. The gold NP and AFM tip are interacting with a surface evanescent wave, resulting a near-field coupling between the tip and NP and consequently enhances the absorption. This concept can be used for selective heating of NPs placed over a surface that enables precise manufacturing at nanometer scales. Different tip positions are considered to identify the optimal tip location and the corresponding enhancement limits. The effects of these interactions on the absorption profiles of dielectric core/gold shell NPs are also studied. It is observed that using core-shell nanoparticles with a dielectric core leads to further enhancement of the absorption efficiency and a more uniform distribution of absorption over the shell. Discrete dipole approximation coupled with surface interactions (DDA-SI) is employed throughout the study, and it is vectorized to improve its computational efficiency.

  11. Detection of Pathogens Using AFM and SPR

    NASA Astrophysics Data System (ADS)

    Vaseashta, Ashok

    2005-03-01

    A priori detection of pathogens in food and water has become a subject of paramount importance. Several recent incidents have resulted in the government passing stringent regulations for tolerable amounts of contamination of food products. Identification and/or monitoring of bacterial contamination in food are critical. The conventional methods of pathogen detection require time-consuming steps to arrive disembark at meaningful measurement in a timely manner as the detection time exceeds the time in which perishable food recycles through the food chain distribution. The aim of this presentation is to outline surface plasmon resonance (SPR) and atomic force microscopy (AFM) as two methods for fast detect6ion of pathogens. Theoretical basis of SPR and experimental results of SPR and AFM on E. coli O157:H7 and prion are presented.

  12. Fabricating optical fibre-top cantilevers for temperature sensing

    NASA Astrophysics Data System (ADS)

    Li, J.; Albri, F.; Sun, J. N.; Miliar, M. M.; Maier, R. R. J.; Hand, D. P.; MacPherson, W. N.

    2014-03-01

    In this paper, we propose techniques to fabricate micro-cantilevers onto the end of standard single mode optical fibres using a combination of picosecond laser machining and focused ion beam milling techniques and demonstrate their use as temperature sensors. Using this approach the cantilever can be pre-aligned with the core of the fibre during fabrication, therefore offering a stable and straightforward means of optically addressing the cantilever. The cantilever is designed to measure deflection over a range of 10 µm using a simple readout technique. A phase recovery algorithm is employed to reduce the interrogation error to around 2-3 nm. Finally, a temperature cycling experiment demonstrates that the cantilever could be used as a temperature sensor from room temperature to 500 °C with an average rms temperature error from 20 °C to 500 °C of ˜±1.4 °C.

  13. Microfabricated cantilever-based detector for molecular beam experiments

    NASA Astrophysics Data System (ADS)

    Bachels, T.; Schäfer, R.

    1998-11-01

    A low cost detector for particles in molecular beam experiments is presented which can easily be mounted in a molecular beam apparatus. The detector is based on microfabricated cantilevers, which can be employed either as single sensors or as sensor arrays. The single cantilever technique has been used to measure the absolute number of atoms coming out of a pulsed laser vaporization cluster source. The particles are detected by the shift of the thermally excited resonance frequency of the cantilever due to the cluster deposition. We have determined with the single cantilever the ratio of neutral to ionized clusters and we have investigated the cluster generation at different source conditions. In addition to this, a microfabricated cantilever array has been used to measure molecular beam profiles, which opens new possibilities for molecular beam deflection experiments.

  14. Cantilever transducers as a platform for chemical and biological sensors

    NASA Astrophysics Data System (ADS)

    Lavrik, Nickolay V.; Sepaniak, Michael J.; Datskos, Panos G.

    2004-07-01

    Since the late 1980s there have been spectacular developments in micromechanical or microelectro-mechanical (MEMS) systems which have enabled the exploration of transduction modes that involve mechanical energy and are based primarily on mechanical phenomena. As a result an innovative family of chemical and biological sensors has emerged. In this article, we discuss sensors with transducers in a form of cantilevers. While MEMS represents a diverse family of designs, devices with simple cantilever configurations are especially attractive as transducers for chemical and biological sensors. The review deals with four important aspects of cantilever transducers: (i) operation principles and models; (ii) microfabrication; (iii) figures of merit; and (iv) applications of cantilever sensors. We also provide a brief analysis of historical predecessors of the modern cantilever sensors.

  15. AFM Investigation of Liquid-Filled Polymer Microcapsules Elasticity.

    PubMed

    Sarrazin, Baptiste; Tsapis, Nicolas; Mousnier, Ludivine; Taulier, Nicolas; Urbach, Wladimir; Guenoun, Patrick

    2016-05-10

    Elasticity of polymer microcapsules (MCs) filled with a liquid fluorinated core is studied by atomic force microscopy (AFM). Accurately characterized spherical tips are employed to obtain the Young's moduli of MCs having four different shell thicknesses. We show that those moduli are effective ones because the samples are composites. The strong decrease of the effective MC elasticity (from 3.0 to 0.1 GPa) as the shell thickness decreases (from 200 to 10 nm) is analyzed using a novel numerical approach. This model describes the evolution of the elasticity of a coated half-space according to the contact radius, the thickness of the film, and the elastic moduli of bulk materials. This numerical model is consistent with the experimental data and allows simulating the elastic behavior of MCs at high frequencies (5 MHz). While the quasi-static elasticity of the MCs is found to be very dependent on the shell thickness, the high frequency (5 MHz) elastic behavior of the core leads to a stable behavior of the MCs (from 2.5 to 3 GPa according to the shell thickness). Finally, the effect of thermal annealing on the MCs elasticity is investigated. The Young's modulus is found to decrease because of the reduction of the shell thickness due to the loss of the polymer. PMID:27058449

  16. Dynamic modeling and sensitivity analysis of dAFM in the transient and steady state motions.

    PubMed

    Payam, Amir Farokh

    2016-10-01

    In this paper, based on the slow time varying function theory, dynamical equations for the amplitude and phase of the dynamic atomic force microscope are derived. Then, the sensitivity of the amplitude and phase to the dissipative and conservative parts of interaction force is investigated. The most advantage of this dynamical model is the ability to simulate and analysis the dynamics behavior of amplitude and phase of the AFM tip motion not only in the steady state but also in the transient regime. Using numerical analysis the transient and steady state behavior of amplitude and phase is studied and the sensitivity of amplitude and phase to the interaction force is analyzed. PMID:27448201

  17. Simulation of Tip-Sample Interaction in the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    Good, Brian S.; Banerjea, Amitava

    1994-01-01

    Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.

  18. Cell visco-elasticity measured with AFM and optical trapping at sub-micrometer deformations.

    PubMed

    Nawaz, Schanila; Sánchez, Paula; Bodensiek, Kai; Li, Sai; Simons, Mikael; Schaap, Iwan A T

    2012-01-01

    The measurement of the elastic properties of cells is widely used as an indicator for cellular changes during differentiation, upon drug treatment, or resulting from the interaction with the supporting matrix. Elasticity is routinely quantified by indenting the cell with a probe of an AFM while applying nano-Newton forces. Because the resulting deformations are in the micrometer range, the measurements will be affected by the finite thickness of the cell, viscous effects and even cell damage induced by the experiment itself. Here, we have analyzed the response of single 3T3 fibroblasts that were indented with a micrometer-sized bead attached to an AFM cantilever at forces from 30-600 pN, resulting in indentations ranging from 0.2 to 1.2 micrometer. To investigate the cellular response at lower forces up to 10 pN, we developed an optical trap to indent the cell in vertical direction, normal to the plane of the coverslip. Deformations of up to two hundred nanometers achieved at forces of up to 30 pN showed a reversible, thus truly elastic response that was independent on the rate of deformation. We found that at such small deformations, the elastic modulus of 100 Pa is largely determined by the presence of the actin cortex. At higher indentations, viscous effects led to an increase of the apparent elastic modulus. This viscous contribution that followed a weak power law, increased at larger cell indentations. Both AFM and optical trapping indentation experiments give consistent results for the cell elasticity. Optical trapping has the benefit of a lower force noise, which allows a more accurate determination of the absolute indentation. The combination of both techniques allows the investigation of single cells at small and large indentations and enables the separation of their viscous and elastic components. PMID:23028915

  19. Robust energy harvesting from walking vibrations by means of nonlinear cantilever beams

    NASA Astrophysics Data System (ADS)

    Kluger, Jocelyn M.; Sapsis, Themistoklis P.; Slocum, Alexander H.

    2015-04-01

    In the present work we examine how mechanical nonlinearity can be appropriately utilized to achieve strong robustness of performance in an energy harvesting setting. More specifically, for energy harvesting applications, a great challenge is the uncertain character of the excitation. The combination of this uncertainty with the narrow range of good performance for linear oscillators creates the need for more robust designs that adapt to a wider range of excitation signals. A typical application of this kind is energy harvesting from walking vibrations. Depending on the particular characteristics of the person that walks as well as on the pace of walking, the excitation signal obtains completely different forms. In the present work we study a nonlinear spring mechanism that is composed of a cantilever wrapping around a curved surface as it deflects. While for the free cantilever, the force acting on the free tip depends linearly on the tip displacement, the utilization of a contact surface with the appropriate distribution of curvature leads to essentially nonlinear dependence between the tip displacement and the acting force. The studied nonlinear mechanism has favorable mechanical properties such as low frictional losses, minimal moving parts, and a rugged design that can withstand excessive loads. Through numerical simulations we illustrate that by utilizing this essentially nonlinear element in a 2 degrees-of-freedom (DOF) system, we obtain strongly nonlinear energy transfers between the modes of the system. We illustrate that this nonlinear behavior is associated with strong robustness over three radically different excitation signals that correspond to different walking paces. To validate the strong robustness properties of the 2DOF nonlinear system, we perform a direct parameter optimization for 1DOF and 2DOF linear systems as well as for a class of 1DOF and 2DOF systems with nonlinear springs similar to that of the cubic spring that are physically realized

  20. Structure and stability of semiconductor tip apexes for atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Pou, P.; Ghasemi, S. A.; Jelinek, P.; Lenosky, T.; Goedecker, S.; Perez, R.

    2009-07-01

    The short range force between the tip and the surface atoms, that is responsible for atomic-scale contrast in atomic force microscopy (AFM), is mainly controlled by the tip apex. Thus, the ability to image, manipulate and chemically identify single atoms in semiconductor surfaces is ultimately determined by the apex structure and its composition. Here we present a detailed and systematic study of the most common structures that can be expected at the apex of the Si tips used in experiments. We tackle the determination of the structure and stability of Si tips with three different approaches: (i) first principles simulations of small tip apexes; (ii) simulated annealing of a Si cluster; and (iii) a minima hopping study of large Si tips. We have probed the tip apexes by making atomic contacts between the tips and then compared force-distance curves with the experimental short range forces obtained with dynamic force spectroscopy. The main conclusion is that although there are multiple stable solutions for the atomically sharp tip apexes, they can be grouped into a few types with characteristic atomic structures and properties. We also show that the structure of the last atomic layers in a tip apex can be both crystalline and amorphous. We corroborate that the atomically sharp tips are thermodynamically stable and that the tip-surface interaction helps to produce the atomic protrusion needed to get atomic resolution.