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Sample records for afm cantilever tip

  1. Effect of tip mass on frequency response and sensitivity of AFM cantilever in liquid.

    PubMed

    Farokh Payam, Amir; Fathipour, Morteza

    2015-03-01

    The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) cantilever in the liquid environment is investigated. For this purpose, using Euler-Bernoulli beam theory and considering tip mass and hydrodynamic functions in a liquid environment, an expression for the resonance frequencies of AFM cantilever in liquid is derived. Then, based on this expression, the effect of the surface contact stiffness on the flexural mode of a rectangular AFM cantilever in fluid is investigated and compared with the case where the AFM cantilever operates in the air. The results show that in contrast with an air environment, the tip mass has no significant impact on the resonance frequency and sensitivity of the AFM cantilever in the liquid. Hence, analysis of AFM behaviour in liquid environment by neglecting the tip mass is logical. PMID:25562584

  2. Insight into mechanics of AFM tip-based nanomachining: bending of cantilevers and machined grooves

    NASA Astrophysics Data System (ADS)

    Al-Musawi, R. S. J.; Brousseau, E. B.; Geng, Y.; Borodich, F. M.

    2016-09-01

    Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study describes an important phenomenon specific for AFM nanomachining in the forward direction: under certain processing conditions, the deformed shape of the cantilever probe may change from a convex to a concave orientation. The phenomenon can principally change the depth and width of grooves machined, e.g. the grooves machined on a single crystal copper specimen may increase by 50% on average following such a change in the deformed shape of the cantilever. It is argued that this phenomenon can take place even when the AFM-based tool is operated in the so-called force-controlled mode. The study involves the refined theoretical analysis of cantilever probe bending, the analysis of experimental signals monitored during the backward and forward AFM tip-based machining and the inspection of the topography of produced grooves.

  3. Insight into mechanics of AFM tip-based nanomachining: bending of cantilevers and machined grooves.

    PubMed

    Al-Musawi, R S J; Brousseau, E B; Geng, Y; Borodich, F M

    2016-09-23

    Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study describes an important phenomenon specific for AFM nanomachining in the forward direction: under certain processing conditions, the deformed shape of the cantilever probe may change from a convex to a concave orientation. The phenomenon can principally change the depth and width of grooves machined, e.g. the grooves machined on a single crystal copper specimen may increase by 50% on average following such a change in the deformed shape of the cantilever. It is argued that this phenomenon can take place even when the AFM-based tool is operated in the so-called force-controlled mode. The study involves the refined theoretical analysis of cantilever probe bending, the analysis of experimental signals monitored during the backward and forward AFM tip-based machining and the inspection of the topography of produced grooves. PMID:27532247

  4. AFM cantilever vibration detection with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Woehl, Taylor; Wagner, Ryan; Keller, Robert; Killgore, Jason

    Cantilever oscillations for dynamic atomic force microscopy (AFM) are conventionally measured with an optical lever system. The speed of AFM cantilevers can be increased by decreasing the size of the cantilever; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the current optical lever approach. Here we demonstrate an electron detection scheme in an SEM for detecting AFM cantilever oscillations. An oscillating AFM tip is positioned perpendicular to the propagation direction of a stationary ~ 1 nm diameter electron probe, and the oscillatory change in electron scattering resulting from the changing thickness of the electron irradiated area of the AFM tip is detected with a transmitted electron detector positioned below the AFM tip. We perform frequency sweep and ring-down experiments to determine the first resonant frequency and Q factor of an AFM cantilever.

  5. Influence of the tip mass and position on the AFM cantilever dynamics: coupling between bending, torsion and flexural modes.

    PubMed

    Mokhtari-Nezhad, F; Saidi, A R; Ziaei-Rad, S

    2009-08-01

    The effects of the geometrical asymmetric related to tip position as a concentrated mass, on the sensitivity of all three vibration modes, lateral excitation (LE), torsional resonance (TR) and vertical excitation (VE), of an atomic force microscopy (AFM) microcantilever have been analyzed. The effects of the tip mass and its position are studied to report the novel results to estimating the vibration behavior of AFM such as resonance frequency and amplitude of the microcantilever. In this way, to achieve more accurate results, the coupled motion in all three modes is considered. In particular, it is investigated that performing the coupled motion in analysis of AFM microcantilever is almost necessary. It is shown that the tip mass and its position have significant effects on vibrational responses. The results show that considering the tip mass decreases the resonance frequencies particularly on high-order modes. However, dislocating of tip position has an inverse effect that causes an increase in the resonance frequencies. In addition, it has been shown that the amplitude of the AFM microcantilever is affected by the influences of tip and its position. These effects are caused by the interaction between flexural and torsional motion due to the moment of inertia of the tip mass. PMID:19559530

  6. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.

    PubMed

    Gates, Richard S; Pratt, Jon R

    2012-09-21

    Accurate cantilever spring constants are important in atomic force microscopy both in control of sensitive imaging and to provide correct nanomechanical property measurements. Conventional atomic force microscope (AFM) spring constant calibration techniques are usually performed in an AFM. They rely on significant handling and often require touching the cantilever probe tip to a surface to calibrate the optical lever sensitivity of the configuration. This can damage the tip. The thermal calibration technique developed for laser Doppler vibrometry (LDV) can be used to calibrate cantilevers without handling or touching the tip to a surface. Both flexural and torsional spring constants can be measured. Using both Euler-Bernoulli modeling and an SI traceable electrostatic force balance technique as a comparison we demonstrate that the LDV thermal technique is capable of providing rapid calibrations with a combination of ease, accuracy and precision beyond anything previously available.

  7. Thermo-magnetic behaviour of AFM-MFM cantilevers

    NASA Astrophysics Data System (ADS)

    Kumar, M.; Arinero, R.; Bergez, W.; Tordjeman, Ph

    2015-08-01

    Atomic force microscopy (AFM) experiments were performed to study the behaviour of AFM cantilevers under an external magnetic field B and temperature field produced by a coil with an iron core. Four cantilever types were studied. Forces were measured for different B values and at various coil-to-cantilever separation distances. The results were analysed on the basis of a phenomenological model. This model contains the contribution of two terms, one monopole-monopole interaction at short distance, and one apparent paramagnetic interaction in \

  8. An approach towards 3D sensitive AFM cantilevers

    NASA Astrophysics Data System (ADS)

    Koops, Richard; Fokkema, Vincent

    2014-04-01

    The atomic force microscope (AFM) tapping mode is a highly sensitive local probing technique that is very useful to study and measure surface properties down to the atomic scale. The tapping mode is mostly implemented using the resonance of the first bending mode of the cantilever and therefore provides sensitivity mainly along the direction of this oscillation. Driven by the semiconductor industry, there is an increasing need for accurate measurements of nanoscale structures for side wall characterization by AFM that requires additional sensitivity in the lateral direction. The conventional tapping mode has been augmented by various authors, for example by tilting the cantilever system (Cho et al 2011 Rev. Sci. Instrum. 82 023707) to access the sidewall or using a torsion mode (Dai et al 2011 Meas. Sci. Technol. 22 094009) of the cantilever to provide additional lateral sensitivity. These approaches however trade lateral sensitivity for vertical sensitivity or still lack sensitivity in the remaining lateral direction. We present an approach towards true 3D sensitivity for AFM cantilevers based on simultaneous excitation and optical detection of multiple cantilever resonance modes along three axes. Tuning the excitation of the cantilever to specific frequencies provides a mechanism to select only those cantilever modes that have the desired characteristics. Additionally, cantilever engineering has been used to design and create a substructure within the cantilever that has been optimized for specific resonance behavior around 4 MHz. In contrast to the conventional approach of using a piezo to actuate the cantilever modulation, we present results on photo-thermal excitation using an intensity modulated low-power laser source. By tightly focusing the excitation spot on the cantilever we were able to attain a deflection efficiency of 0.7 nm µW-1 for the first bending mode. The presented approach results in an efficient all optical excitation and deflection detection

  9. Intrinsically high-Q dynamic AFM imaging in liquid with a significantly extended needle tip

    NASA Astrophysics Data System (ADS)

    Minary-Jolandan, Majid; Tajik, Arash; Wang, Ning; Yu, Min-Feng

    2012-06-01

    Atomic force microscope (AFM) probe with a long and rigid needle tip was fabricated and studied for high Q factor dynamic (tapping mode) AFM imaging of samples submersed in liquid. The extended needle tip over a regular commercially available tapping-mode AFM cantilever was sufficiently long to keep the AFM cantilever from submersed in liquid, which significantly minimized the hydrodynamic damping involved in dynamic AFM imaging of samples in liquid. Dynamic AFM imaging of samples in liquid at an intrinsic Q factor of over 100 and an operational frequency of over 200 kHz was demonstrated. The method has the potential to be extended to acquire viscoelastic material properties and provide truly gentle imaging of soft biological samples in physiological environments.

  10. Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

    PubMed Central

    Dixson, Ronald G.; Orji, Ndubuisi G.; Goldband, Ryan S.

    2016-01-01

    Sidewall sensing in critical dimension atomic force microscopes (CD-AFMs) usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM) probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. Understanding the influence and dependence of the effective tip width on the dither settings and lateral stiffness of the tip can improve the measurement accuracy and uncertainty estimation for CD-AFM measurements. Since CD-AFM typically uses tips that range from 15 nm to 850 nm in geometrical width, the behavior of effective tip width throughout this range should be understood. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. For tip widths of 130 nm and lower, which also have lower lateral stiffness, the response of the effective tip width to lateral dither is greater than for larger tips. However, we have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To validate that our prior conclusions about the dependence of effective tip width on lateral stiffness are valid for large CD-tips, we recently performed experiments using a very large non-CD tip with an etched plateau of approximately 2 μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm

  11. SU-8 hollow cantilevers for AFM cell adhesion studies

    NASA Astrophysics Data System (ADS)

    Martinez, Vincent; Behr, Pascal; Drechsler, Ute; Polesel-Maris, Jérôme; Potthoff, Eva; Vörös, Janos; Zambelli, Tomaso

    2016-05-01

    A novel fabrication method was established to produce flexible, transparent, and robust tipless hollow atomic force microscopy (AFM) cantilevers made entirely from SU-8. Channels of 3 μm thickness and several millimeters length were integrated into 12 μm thick and 40 μm wide cantilevers. Connected to a pressure controller, the devices showed high sealing performance with no leakage up to 6 bars. Changing the cantilever lengths from 100 μm to 500 μm among the same wafer allowed the targeting of various spring constants ranging from 0.5 to 80 N m-1 within a single fabrication run. These hollow polymeric AFM cantilevers were operated in the optical beam deflection configuration. To demonstrate the performance of the device, single-cell force spectroscopy experiments were performed with a single probe detaching in a serial protocol more than 100 Saccharomyces cerevisiae yeast cells from plain glass and glass coated with polydopamine while measuring adhesion forces in the sub-nanoNewton range. SU-8 now offers a new alternative to conventional silicon-based hollow cantilevers with more flexibility in terms of complex geometric design and surface chemistry modification.

  12. SU-8 hollow cantilevers for AFM cell adhesion studies

    NASA Astrophysics Data System (ADS)

    Martinez, Vincent; Behr, Pascal; Drechsler, Ute; Polesel-Maris, Jérôme; Potthoff, Eva; Vörös, Janos; Zambelli, Tomaso

    2016-05-01

    A novel fabrication method was established to produce flexible, transparent, and robust tipless hollow atomic force microscopy (AFM) cantilevers made entirely from SU-8. Channels of 3 μm thickness and several millimeters length were integrated into 12 μm thick and 40 μm wide cantilevers. Connected to a pressure controller, the devices showed high sealing performance with no leakage up to 6 bars. Changing the cantilever lengths from 100 μm to 500 μm among the same wafer allowed the targeting of various spring constants ranging from 0.5 to 80 N m‑1 within a single fabrication run. These hollow polymeric AFM cantilevers were operated in the optical beam deflection configuration. To demonstrate the performance of the device, single-cell force spectroscopy experiments were performed with a single probe detaching in a serial protocol more than 100 Saccharomyces cerevisiae yeast cells from plain glass and glass coated with polydopamine while measuring adhesion forces in the sub-nanoNewton range. SU-8 now offers a new alternative to conventional silicon-based hollow cantilevers with more flexibility in terms of complex geometric design and surface chemistry modification.

  13. Resonance Frequency Analysis for Surface-Coupled AFM Cantilever in Liquids

    SciTech Connect

    Mirman, B; Kalinin, Sergei V

    2008-01-01

    Shifts in the resonance frequencies of surface-coupled atomic force microscope (AFM) probes are used as the basis for the detection mechanisms in a number of scanning probe microscopy techniques including atomic force acoustic microscopy (AFAM), force modulation microscopy, and resonance enhanced piezoresponse force microscopy (PFM). Here, we analyze resonance characteristics for AFM cantilever coupled to surface in liquid environment, and derive approximate expressions for resonant frequencies as a function of vertical and lateral spring constant of the tip-surface junction. This analysis provides a simplified framework for the interpretation of AFAM and PFM data in ambient, liquid, and vacuum environments.

  14. Analysis of AFM cantilever dynamics close to sample surface

    NASA Astrophysics Data System (ADS)

    Habibnejad Korayem, A.; Habibnejad Korayem, Moharam; Ghaderi, Reza

    2013-07-01

    For imaging and manipulation of biological specimens application of atomic force microscopy (AFM) in liquid is necessary. In this paper, tapping-mode AFM cantilever dynamics in liquid close to sample surface is modeled and simulated by well defining the contact forces. The effect of cantilever tilting angle has been accounted carefully. Contact forces have some differences in liquid in comparison to air or vacuum in magnitude or formulation. Hydrodynamic forces are also applied on the cantilever due to the motion in liquid. A continuous beam model is used with its first mode and forward-time simulation method for simulation of its hybrid dynamics and the frequency response and amplitude versus separation diagrams are extracted. The simulation results show a good agreement with experimental results. The resonance frequency in liquid is so small in comparison to air due to additional mass and also additional damping due to the viscosity of the liquid around. The results show that the effect of separation on free vibration amplitude is great. Its effect on resonance frequency is considerable too.

  15. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Killgore, Jason P.; Tung, Ryan C.; Hurley, Donna C.

    2014-08-01

    Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties, such as contact resonance force microscopy, creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an atomic force microscope cantilever’s vibrational modes, it is essential to understand how the vibrations of the U-shaped HT-AFM cantilever differ from those of a more traditional rectangular lever, for which analytical techniques are better developed. Here we show, with a combination of finite element analysis (FEA) and experiments, that the HT-AFM cantilever exhibits many more readily-excited vibrational modes over typical AFM frequencies compared to a rectangular cantilever. The arms of U-shaped HT-AFM cantilevers exhibit two distinct forms of flexural vibrations that differ depending on whether the two arms are vibrating in-phase or out-of-phase with one another. The in-phase vibrations are qualitatively similar to flexural vibrations in rectangular cantilevers and generally show larger sensitivity to surface stiffness changes than the out-of-phase vibrations. Vibration types can be identified from their frequency and by considering vibration amplitudes in the horizontal and vertical channels of the AFM at different laser spot positions on the cantilever. For identifying contact resonance vibrational modes, we also consider the sensitivity of the resonant frequencies to a change in applied force and hence to tip-sample contact stiffness. Finally, we assess how existing analytical models can be used to accurately predict contact stiffness from contact-resonance HT-AFM results. A simple two-parameter Euler-Bernoulli beam model provided good agreement with FEA for in-phase modes up to a contact stiffness 500 times the cantilever spring constant. By providing insight into cantilever vibrations and exploring the potential of current analysis techniques, our results lay the

  16. Cantilever energy effects on bimodal AFM: phase and amplitude contrast of multicomponent samples

    NASA Astrophysics Data System (ADS)

    Chakraborty, Ishita; Yablon, Dalia G.

    2013-11-01

    Bimodal atomic force microscopy (AFM) is a recently developed technique of dynamic AFM where a higher eigenmode of the cantilever is simultaneously excited along with the fundamental eigenmode. The effects of different operating parameters while imaging an impact copolymer blend of polypropylene (PP) and ethylene-propylene (E-P) rubber in bimodal mode are explored through experiments and numerical simulations. The higher mode amplitude and phase contrasts between the two components of the sample reverse at different points as the free amplitude of the higher eigenmode is increased. Three different regimes are identified experimentally depending on the relative contrast between the PP and the E-P rubber. It is observed that the kinetic energy and free air drive input energy of the two cantilever eigenmodes play a role in determining the regimes of operation. Numerical simulations conducted with appropriate tip-sample interaction forces support the experimental results. An understanding of these regimes and the associated cantilever dynamics will guide a rational approach towards selecting appropriate operating parameters.

  17. Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires

    DOEpatents

    Lee, James Weifu; Lowndes, Douglas H.; Merkulov, Vladimir I.; Eres, Gyula; Wei, Yayi; Greenbaum, Elias; Lee, Ida

    2004-06-29

    A method is described for catalyst-induced growth of carbon nanotubes, nanofibers, and other nanostructures on the tips of nanowires, cantilevers, conductive micro/nanometer structures, wafers and the like. The method can be used for production of carbon nanotube-anchored cantilevers that can significantly improve the performance of scaning probe microscopy (AFM, EFM etc). The invention can also be used in many other processes of micro and/or nanofabrication with carbon nanotubes/fibers. Key elements of this invention include: (1) Proper selection of a metal catalyst and programmable pulsed electrolytic deposition of the desired specific catalyst precisely at the tip of a substrate, (2) Catalyst-induced growth of carbon nanotubes/fibers at the catalyst-deposited tips, (3) Control of carbon nanotube/fiber growth pattern by manipulation of tip shape and growth conditions, and (4) Automation for mass production.

  18. Insulated Conducting Cantilevered Nanotips and Two-Chamber Recording System for High Resolution Ion Sensing AFM

    NASA Astrophysics Data System (ADS)

    Meckes, Brian; Arce, Fernando Teran; Connelly, Laura S.; Lal, Ratnesh

    2014-03-01

    Biological membranes contain ion channels, which are nanoscale pores allowing controlled ionic transport and mediating key biological functions underlying normal/abnormal living. Synthetic membranes with defined pores are being developed to control various processes, including filtration of pollutants, charge transport for energy storage, and separation of fluids and molecules. Although ionic transport (currents) can be measured with single channel resolution, imaging their structure and ionic currents simultaneously is difficult. Atomic force microscopy enables high resolution imaging of nanoscale structures and can be modified to measure ionic currents simultaneously. Moreover, the ionic currents can also be used to image structures. A simple method for fabricating conducting AFM cantilevers to image pore structures at high resolution is reported. Tungsten microwires with nanoscale tips are insulated except at the apex. This allows simultaneous imaging via cantilever deflections in normal AFM force feedback mode as well as measuring localized ionic currents. These novel probes measure ionic currents as small as picoampere while providing nanoscale spatial resolution surface topography and is suitable for measuring ionic currents and conductance of biological ion channels.

  19. Insulated Conducting Cantilevered Nanotips and Two-Chamber Recording System for High Resolution Ion Sensing AFM

    PubMed Central

    Meckes, Brian; Arce, Fernando Teran; Connelly, Laura S.; Lal, Ratnesh

    2014-01-01

    Biological membranes contain ion channels, which are nanoscale pores allowing controlled ionic transport and mediating key biological functions underlying normal/abnormal living. Synthetic membranes with defined pores are being developed to control various processes, including filtration of pollutants, charge transport for energy storage, and separation of fluids and molecules. Although ionic transport (currents) can be measured with single channel resolution, imaging their structure and ionic currents simultaneously is difficult. Atomic force microscopy enables high resolution imaging of nanoscale structures and can be modified to measure ionic currents simultaneously. Moreover, the ionic currents can also be used to image structures. A simple method for fabricating conducting AFM cantilevers to image pore structures at high resolution is reported. Tungsten microwires with nanoscale tips are insulated except at the apex. This allows simultaneous imaging via cantilever deflections in normal AFM force feedback mode as well as measuring localized ionic currents. These novel probes measure ionic currents as small as picoampere while providing nanoscale spatial resolution surface topography and is suitable for measuring ionic currents and conductance of biological ion channels. PMID:24663394

  20. Probing mechanical properties of living cells by atomic force microscopy with blunted pyramidal cantilever tips.

    PubMed

    Rico, Félix; Roca-Cusachs, Pere; Gavara, Núria; Farré, Ramon; Rotger, Mar; Navajas, Daniel

    2005-08-01

    Atomic force microscopy (AFM) allows the acquisition of high-resolution images and the measurement of mechanical properties of living cells under physiological conditions. AFM cantilevers with blunted pyramidal tips are commonly used to obtain images of living cells. Measurement of mechanical properties with these tips requires a contact model that takes into account their blunted geometry. The aim of this work was to develop a contact model of a blunted pyramidal tip and to assess the suitability of pyramidal tips for probing mechanical properties of soft gels and living cells. We developed a contact model of a blunted pyramidal tip indenting an elastic half-space. We measured Young's modulus (E) and the complex shear modulus (G*= G' +i G" ) of agarose gels and A549 alveolar epithelial cells with pyramidal tips and compared them with those obtained with spherical tips. The gels exhibited an elastic behavior with almost coincident loading and unloading force curves and negligible values of G". E fell sharply with indentation up to approximately 300 nm , showing a linear regime for deeper indentations. A similar indentation dependence of E with twofold lower values at the linear regime was obtained with the spherical tip fitted with Hertz's model. The dependence of E on indentation in cells paralleled that found in gels. Cells exhibited viscoelastic behavior with G"/G' approximately 1/4 . Pyramidal tips commonly used for AFM imaging are suitable for probing mechanical properties of soft gels and living cells. PMID:16196611

  1. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  2. Accurate calibration and uncertainty estimation of the normal spring constant of various AFM cantilevers.

    PubMed

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-03-10

    Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical properties of materials in the biophysics and nanomechanical fields. The atomic force microscope (AFM) is widely used in microforce measurement. The cantilever probe works as an AFM force sensor, and the spring constant of the cantilever is of great significance to the accuracy of the measurement results. This paper presents a normal spring constant calibration method with the combined use of an electromagnetic balance and a homemade AFM head. When the cantilever presses the balance, its deflection is detected through an optical lever integrated in the AFM head. Meanwhile, the corresponding bending force is recorded by the balance. Then the spring constant can be simply calculated using Hooke's law. During the calibration, a feedback loop is applied to control the deflection of the cantilever. Errors that may affect the stability of the cantilever could be compensated rapidly. Five types of commercial cantilevers with different shapes, stiffness, and operating modes were chosen to evaluate the performance of our system. Based on the uncertainty analysis, the expanded relative standard uncertainties of the normal spring constant of most measured cantilevers are believed to be better than 2%.

  3. High Q optical fiber tips for NC-AFM in liquid.

    PubMed

    LeDue, J M; Lopez-Ayon, M; Burke, S A; Miyahara, Y; Grütter, P

    2009-07-01

    Non-contact atomic force microscopy is rapidly expanding from ultra-high vacuum to include the study of surfaces and biomolecules in liquids by high resolution imaging and force spectroscopy. This is despite the additional frequency shift noise due to the inherently low Q factor of the cantilever oscillating in a liquid. In this paper we present a tip based on an optical fiber which can operate in liquid with Q factors in excess of 100 using a 'diving bell' arrangement which allows only a small portion of the tip to be submerged. We demonstrate stable imaging and force spectroscopy using this set-up. The tips are based on scanning near-field optical microscopy tips and, when used with NC-AFM, provide a method of combining both high resolution mechanical and fluorescence studies of biomolecules and cells. PMID:19509445

  4. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    NASA Astrophysics Data System (ADS)

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-07-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation.

  5. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    PubMed Central

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-01-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation. PMID:27452115

  6. Theoretical modelling of AFM for bimetallic tip-substrate interactions

    NASA Technical Reports Server (NTRS)

    Bozzolo, Guillermo; Ferrante, John

    1991-01-01

    Recently, a new technique for calculating the defect energetics of alloys based on Equivalent Crystal Theory was developed. This new technique successfully predicts the bulk properties for binary alloys as well as segregation energies in the dilute limit. The authors apply this limit for the calculation of energy and force as a function of separation of an atomic force microscope (AFM) tip and substrate. The study was done for different combinations of tip and sample materials. The validity of the universality discovered for the same metal interfaces is examined for the case of different metal interactions.

  7. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    PubMed Central

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-01-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air. PMID:26574164

  8. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    NASA Astrophysics Data System (ADS)

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-11-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air.

  9. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    NASA Technical Reports Server (NTRS)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  10. Phase-Imaging with a Sharpened Multi-Walled Carbon Nanotube AFM Tip: Investigation of Low-k Dielectric Polymer Hybrids

    NASA Technical Reports Server (NTRS)

    Nguyen, Cattien V.; Stevens, Ramsey M.; Meyyappan, M.; Volksen, Willi; Miller, Robert D.

    2005-01-01

    Phase shift tapping mode scanning force microscopy (TMSFM) has evolved into a very powerful technique for the nanoscale surface characterization of compositional variations in heterogeneous samples. Phase shift signal measures the difference between the phase angle of the excitation signal and the phase angle of the cantilever response. The signal correlates to the tip-sample inelastic interactions, identifying the different chemical and/or physical property of surfaces. In general, the resolution and quality of scanning probe microscopic images are highly dependent on the size of the scanning probe tip. In improving AFM tip technology, we recently developed a technique for sharpening the tip of a multi-walled carbon nanotube (CNT) AFM tip, reducing the radius of curvature of the CNT tip to less than 5 nm while still maintaining the inherent stability of multi-walled CNT tips. Herein we report the use of sharpened (CNT) AFM tips for phase-imaging of polymer hybrids, a precursor for generating nanoporous low-k dielectrics for on-chip interconnect applications. Using sharpened CNT tips, we obtained phase-contrast images having domains less than 10 nm. In contrast, conventional Si tips and unsharpened CNT tips (radius greater than 15 nm) were not able to resolve the nanoscale domains in the polymer hybrid films. C1early, the size of the CNT tip contributes significantly to the resolution of phase-contrast imaging. In addition, a study on the nonlinear tapping dynamics of the multi-walled CNT tip indicates that the multi-walled CNT tip is immune to conventional imaging instabilities related to the coexistence of attractive and repulsive tapping regimes. This factor may also contribute to the phase-contrast image quality of multi-walled CNT AFM tips. This presentation will also offer data in support of the stability of the CNT tip for phase shift TMSFM.

  11. AFM tip effect on a thin liquid film.

    PubMed

    Ledesma-Alonso, R; Legendre, D; Tordjeman, Ph

    2013-06-25

    We study the interaction between an AFM probe and a liquid film deposited over a flat substrate. We investigate the effects of the physical and geometrical parameters, with a special focus on the film thickness E, the probe radius R, and the distance D between the probe and the free surface. Deformation profiles have been calculated from the numerical simulations of the Young-Laplace equation by taking into account the probe/liquid and the liquid/substrate interactions, characterized by the Hamaker constants, Hpl and Hls. We demonstrate that the deformation of a shallow film is determined by a particular characteristic length λF = (2πγE(4)/Hls)(1/2), resulting from the balance between the capillary force (γ is the surface tension) and the van der Waals liquid/substrate attraction. For the case of a bulk liquid, the extent of the interface deformation is simply controlled by the capillary length λC = (γ/Δρg)(1/2). These trends point out two asymptotic regimes, which in turn are bounded by two characteristic film thicknesses Eg = (Hls/2πΔρg)(1/4) and Eγ = (R(2)Hls/2πγ)(1/4). For E > Eg, the bulk behavior is recovered, and for E < Eγ, we show the existence of a particular shallow film regime in which a localized tip effect is observed. This tip effect is characterized by the small magnitude of the deformation and an important restriction of its radial extent λF localized below the probe. In addition, we have found that the film thickness has a significant effect on the threshold separation distance Dmin below which the irreversible jump-to-contact process occurs: Dmin is probe radius-dependent for the bulk whereas it is film-thickness-dependent for shallow films. These results have an important impact on the optimal AFM scanning conditions. PMID:23721486

  12. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew; Eardley, Matthew; Kitching, John

    2015-05-01

    We report the resonant coupling of laser cooled trapped Rb atoms to a micro-cantilever with a magnetic tip. An atom chip is used to trap, cool, and transport the atoms to the tip of the cantilever. The capacitively-driven cantilever oscillation produces Zeeman state transitions which result in a loss of population in the trap. In a suitably scaled setup, mechanical resonators could be used to probe and manipulate atomic spins with nanometer spatial resolution and single-spin sensitivity; this technique may enable new approaches in neutral-atom quantum computation, quantum simulation, or precision sensing.

  13. Fabrication of nanoscale magnet-tipped cantilevers for magnetic resonance force microscopy

    NASA Astrophysics Data System (ADS)

    Hickman, Steven A.; Garner, Sean R.; Harrell, Lee E.; Kuehn, Seppe; Marohn, John A.

    2006-03-01

    Magnetic resonance force microscopy(MRFM) is a promising new technique for acquiring magnetic resonance images of a single molecule; to date we have demonstrated a sensitivity of approximately 10,000 proton spins. In MRFM the force exerted on the cantilever, per spin, is proportional to the field gradient from the cantilever's magnetic tip. To increase the force requires shrinking the magnet size. Achieving the attonewton force sensitivity necessary to image single spins requires mitigating surface induced dissipation. We choose to meet both of these conditions by creating nanoscale magnets extending from the tips of silicon cantilevers. We will present a 50-nm wide overhanging cobalt magnet fabricated by a process involving electron beam lithography and anisotropic KOH etching. This process can be integrated into a fabrication protocol for ultrasensitive silicon cantilevers. With these cantilevers we expect a sensitivity of better than 1000 protons.

  14. AFM tip characterization by using FFT filtered images of step structures.

    PubMed

    Yan, Yongda; Xue, Bo; Hu, Zhenjiang; Zhao, Xuesen

    2016-01-01

    The measurement resolution of an atomic force microscope (AFM) is largely dependent on the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the value of the tip radius is needed in calculations. As such, estimation of the tip radius is important for analyzing results taken using an AFM. In this study, a geometrical model created by scanning a step structure with an AFM tip was developed. The tip was assumed to have a hemispherical cone shape. Profiles simulated by tips with different scanning radii were calculated by fast Fourier transform (FFT). By analyzing the influence of tip radius variation on the spectra of simulated profiles, it was found that low-frequency harmonics were more susceptible, and that the relationship between the tip radius and the low-frequency harmonic amplitude of the step structure varied monotonically. Based on this regularity, we developed a new method to characterize the radius of the hemispherical tip. The tip radii estimated with this approach were comparable to the results obtained using scanning electron microscope imaging and blind reconstruction methods. PMID:26517548

  15. Nanomechanical probing of soft matter through hydrophobic AFM tips fabricated by two-photon polymerization

    NASA Astrophysics Data System (ADS)

    Suriano, Raffaella; Zandrini, Tommaso; De Marco, Carmela; Osellame, Roberto; Turri, Stefano; Bragheri, Francesca

    2016-04-01

    Atomic force microscopy (AFM) nanoindentation of soft materials is a powerful tool for probing mechanical properties of biomaterials. Though many results have been reported in this field over the last decade, adhesion forces between the tip and the sample hinder the elastic modulus measurement when hydrophilic soft samples are investigated. Here, two-photon polymerization (2PP) technology was used to fabricate hydrophobic perfluoropolyether-based AFM tips. The hydrophobic 2PP tips allowed us to overcome the limitations of commercial and functionalized tips as well as to successfully measure the elastic modulus of medically relevant soft materials in air. Our results obtained in the characterization of poly(dimethyl siloxane) and polyethylene glycol hydrogels showed lower adhesion forces over a larger measurement range when compared to measurements performed with commercial tips. The elastic moduli measured by means of hydrophobic 2PP AFM tips were also found to be comparable to those obtained using conventional techniques for macroscopic samples. We successfully showed that the hydrophobic AFM tips developed by this highly versatile technology enable the study of mechanical properties of soft matter, benefiting from reduced sample-tip interactions, and a custom-made shape and dimension of the tips.

  16. Measurement of interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} and immobilized vitronectin on the cantilever tip

    SciTech Connect

    Lee, Minsu; Yang, Hyun-Kyu; Park, Keun-Hyung; Kang, Dong-Ku; Chang, Soo-Ik Kang, In-Cheol

    2007-11-03

    Protein nanoarrays containing integrin {alpha}{sub v}{beta}{sub 3} or BSA were fabricated on ProLinker{sup TM}-coated Au surface by dip-pen nanolithography (DPN). An atomic force microscope (AFM) tip coated with ProLinker{sup TM} was modified by vitronectin. We measured the interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} or BSA and immobilized vitronectin on the cantilever tip by employing tethering-unbinding method. The unbinding force between integrin {alpha}{sub v}{beta}{sub 3} and vitronectin (1087 {+-} 62 pN) was much higher than that of between BSA and vitronectin (643 {+-} 74 pN). These results demonstrate that one can distinguish a specific protein interaction from non-specific interactions by means of force measurement on the molecular interactions between the nanoarrayed protein and its interacting protein on the AFM tip.

  17. High precision attachment of silver nanoparticles on AFM tips by dielectrophoresis.

    PubMed

    Leiterer, Christian; Wünsche, Erik; Singh, Prabha; Albert, Jens; Köhler, Johann M; Deckert, Volker; Fritzsche, Wolfgang

    2016-05-01

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application.

  18. DNA-coated AFM cantilevers for the investigation of cell adhesion and the patterning of live cells

    SciTech Connect

    Hsiao, Sonny C.; Crow, Ailey K.; Lam, Wilbur A.; Bertozzi, Carolyn R.; Fletcher, Daniel A.; Francis, Matthew B.

    2008-08-01

    Measurement of receptor adhesion strength requires the precise manipulation of single cells on a contact surface. To attach live cells to a moveable probe, DNA sequences complementary to strands displayed on the plasma membrane are introduced onto AFM cantilevers (see picture, bp=base pairs). The strength of the resulting linkages can be tuned by varying the length of DNA strands, allowing for controlled transport of the cells.

  19. Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End

    PubMed Central

    Gonzalez, Laura; Martínez-Martín, David; Otero, Jorge; de Pablo, Pedro José; Puig-Vidal, Manel; Gómez-Herrero, Julio

    2015-01-01

    The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. PMID:25594596

  20. Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end.

    PubMed

    Gonzalez, Laura; Martínez-Martín, David; Otero, Jorge; de Pablo, Pedro José; Puig-Vidal, Manel; Gómez-Herrero, Julio

    2015-01-14

    The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.

  1. Rational fabrication of a gold-coated AFM TERS tip by pulsed electrodeposition.

    PubMed

    Yang, Li-Kun; Huang, Teng-Xiang; Zeng, Zhi-Cong; Li, Mao-Hua; Wang, Xiang; Yang, Fang-Zu; Ren, Bin

    2015-11-21

    Reproducible fabrication of sharp gold- or silver-coated tips has become the bottleneck issue in tip-enhanced Raman spectroscopy, especially for atomic force microscopy (AFM)-based TERS. Herein, we developed a novel method based on pulsed electrodeposition to coat a thin gold layer over atomic force microscopy (AFM) tips to produce plasmonic TERS tips with high reproducibility. We systematically investigated the influence of the deposition potential and step time on the surface roughness and sharpness. This method allows the rational control of the radii of gold-coated TERS tips from a few to hundreds of nanometers, which allows us to systematically study the dependence of the TERS enhancement on the radius of the gold-coated AFM tip. The maximum TERS enhancement was achieved for the tip radius in the range of 60-75 nm in the gap mode. The coated gold layer has a strong adhesion with the silicon tip surface, which is highly stable in water, showing the great potential for application in the aqueous environment. PMID:26482226

  2. Closed-form solution for a cantilevered sectorial plate subjected to a tip concentrated force.

    PubMed

    Christy, Carl W; Weggel, David C; Smelser, R E

    2016-01-01

    A closed-form solution is presented for a cantilevered sectorial plate subjected to a tip concentrated force. Since the particular solution for this problem was not found in the literature, it is derived here. Deflections from the total solution (particular plus homogeneous solutions) are compared to those from a finite element analysis and are found to be in excellent agreement, producing an error within approximately 0.08 %. Normalized closed-form deflections and slopes at the fixed support, resulting from an approximate enforcement of the boundary conditions there, deviate from zero by <0.08 %. Finally, the total closed-form solutions for a cantilevered sectorial plate subjected to independent applications of a tip concentrated force, a tip bending moment, and a tip twisting moment, are compiled. PMID:27390653

  3. Study of mechanical behavior of AFM silicon tips under mechanical load

    NASA Astrophysics Data System (ADS)

    Kopycinska-Mueller, M.; Gluch, J.; Köhler, B.

    2016-11-01

    In this paper we address critical issues concerning calibration of AFM based methods used for nanoscale mechanical characterization of materials. It has been shown that calibration approaches based on macroscopic models for contact mechanics may yield excellent results in terms of the indentation modulus of the sample, but fail to provide a comprehensive and actual information concerning the tip–sample contact radius or the mechanical properties of the tip. Explanations for the severely reduced indentation modulus of the tip included the inadequacies of the models used for calculations of the tip–sample contact stiffness, discrepancies in the actual and ideal shape of the tip, presence of the amorphous silicon phase within the silicon tip, as well as negligence of the actual size of the stress field created in the tip during elastic interactions. To clarify these issues, we investigated the influence of the mechanical load applied to four AFM silicon tips on their crystalline state by exposing them to systematically increasing loads, evaluating the character of the tip–sample interactions via the load-unload stiffness curves, and assessing the state of the tips from HR-TEM images. The results presented in this paper were obtained in a series of relatively simple and basic atomic force acoustic microscopy (AFAM) experiments. The novel combination of TEM imaging of the AFM tips with the analysis of the load-unload stiffness curves gave us a detailed insight into their mechanical behavior under load conditions. We were able to identify the limits for the elastic interactions, as well as the hallmarks for phase transformation and dislocation formation and movement. The comparison of the physical dimensions of the AFM tips, geometry parameters determined from the values of the contact stiffness, and the information on the crystalline state of the tips allowed us a better understanding of the nanoscale contact.

  4. Linking of Sensor Molecules with Amino Groups to Amino-Functionalized AFM Tips

    PubMed Central

    2011-01-01

    The measuring tip of an atomic force microscope (AFM) can be upgraded to a specific biosensor by attaching one or a few biomolecules to the apex of the tip. The biofunctionalized tip is then used to map cognate target molecules on a sample surface or to study biophysical parameters of interaction with the target molecules. The functionality of tip-bound sensor molecules is greatly enhanced if they are linked via a thin, flexible polymer chain. In a typical scheme of tip functionalization, reactive groups are first generated on the tip surface, a bifunctional cross-linker is then attached with one of its two reactive ends, and finally the probe molecule of interest is coupled to the free end of the cross-linker. Unfortunately, the most popular functional group generated on the tip surface is the amino group, while at the same time, the only useful coupling functions of many biomolecules (such as antibodies) are also NH2 groups. In the past, various tricks or detours were applied to minimize the undesired bivalent reaction of bifunctional linkers with adjacent NH2 groups on the tip surface. In the present study, an uncompromising solution to this problem was found with the help of a new cross-linker (“acetal-PEG-NHS”) which possesses one activated carboxyl group and one acetal-protected benzaldehyde function. The activated carboxyl ensures rapid unilateral attachment to the amino-functionalized tip, and only then is the terminal acetal group converted into the amino-reactive benzaldehyde function by mild treatment (1% citric acid, 1–10 min) which does not harm the AFM tip. As an exception, AFM tips with magnetic coating become demagnetized in 1% citric acid. This problem was solved by deprotecting the acetal group before coupling the PEG linker to the AFM tip. Bivalent binding of the corresponding linker (“aldehyde-PEG-NHS”) to adjacent NH2 groups on the tip was largely suppressed by high linker concentrations. In this way, magnetic AFM tips could be

  5. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew A.; Eardley, Matthew; Moreland, John; Hollberg, Leo; Kitching, John

    2015-06-01

    Magnetic resonance in an ensemble of laser-cooled trapped Rb atoms is excited using a microcantilever with a magnetic tip. The cantilever is mounted on a multilayer chip designed to capture, cool, and magnetically transport cold atoms. The coupling is observed by measuring the loss from a magnetic trap as the oscillating cantilever induces Zeeman-state transitions in the atoms. Interfacing cold atoms with mechanical devices could enable probing and manipulating atomic spins with nanometer spatial resolution and single-spin sensitivity, leading to new capabilities in quantum computation, quantum simulation, and precision sensing.

  6. Versatile method for AFM-tip functionalization with biomolecules: fishing a ligand by means of an in situ click reaction.

    PubMed

    Kumar, Rakesh; Ramakrishna, Shivaprakash N; Naik, Vikrant V; Chu, Zonglin; Drew, Michael E; Spencer, Nicholas D; Yamakoshi, Yoko

    2015-04-21

    A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions.

  7. Magnetic domain structure investigation of Bi: YIG-thin films by combination of AFM and cantilever-based aperture SNOM

    NASA Astrophysics Data System (ADS)

    Vysokikh, Yu E.; Shelaev, A. V.; Prokopov, A. R.; Shevyakov, V. I.; Krasnoborodko, S. Yu

    2016-08-01

    We present the results of magnetic domain structure investigation by combination of atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). Special hollow-pyramid AFM cantilevers with aperture was used. This combination allows us use same probe for both topography and domain structure visualization of Bi -substituted ferrite garnet films of micro- and nano-meter thickness. Samples were excited through aperture by tightly focused linearly polarized laser beam. Magneto-optical effect rotates polarization of transmitted light depend on domain orientation. Visualization of magnetic domains was performed by detecting cross polarized component of transmitted light. SNOM allows to obtain high resolution magnetic domain image and prevent sample from any disturbance by magnetic probe. Same area SNOM and MFM images are presented.

  8. Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup

    NASA Astrophysics Data System (ADS)

    Cheng, Hui-Wen; Chang, Yuan-Chih; Tang, Song-Nien; Yuan, Chi-Tsu; Tang, Jau; Tseng, Fan-Gang

    2013-11-01

    This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also discuss the mechanisms involved in the attachment of the Au-NP to the very apex of an AFM probe tip. The Au-NP-modified AFM tips were used to pick up individual 4-nm quantum dots (QDs) using a chemically functionalized method. Single QD blinking was reduced considerably on the Au-NP-modified AFM tip. The resulting AFM tips present an excellent platform for the manipulation of single protein molecules in the study of single protein-protein interactions.

  9. Simulation of CNT-AFM tip based on finite element analysis for targeted probe of the biological cell

    NASA Astrophysics Data System (ADS)

    Yousefi, Amin Termeh; Mahmood, Mohamad Rusop; Miyake, Mikio; Ikeda, Shoichiro

    2016-07-01

    Carbon nanotubes (CNTs) are potentially ideal tips for atomic force microscopy (AFM) due to the robust mechanical properties, nano scale diameter and also their ability to be functionalized by chemical and biological components at the tip ends. This contribution develops the idea of using CNTs as an AFM tip in computational analysis of the biological cell's. Finite element analysis employed for each section and displacement of the nodes located in the contact area was monitored by using an output database (ODB). This reliable integration of CNT-AFM tip process provides a new class of high performance nanoprobes for single biological cell analysis.

  10. Fabrication Challenges in Producing Magnet-tipped Cantilevers for Magnetic Resonance Force Microscopy

    NASA Astrophysics Data System (ADS)

    Hickman, Steven A.; Garner, Sean R.; Harrell, Lee E.; Ong, Jeremy C.; Kuehn, Seppe; Marohn, John A.

    2008-03-01

    Magnetic resonance force microscopy (MRFM) is a technique that may allow MR imaging of single molecules -- an extremely exciting prospect. To date we have demonstrated MRFM sensitivity of ˜10^5 proton spins. By making improved magnetic tips and increasing force sensitivity, it may be possible to achieve single-proton sensitivity necessary for molecular imaging. In MRFM the force exerted on the cantilever, per spin, is proportional to the field gradient from the cantilever's magnetic tip. Achieving single proton sensitivity thus requires dramatically reducing magnet size. We have developed an e-beam lithography process for batch fabricating nanoscale magnets on silicon cantilevers. With these sized magnets we will still require attonewton force sensitivity. Research by our group has shown that surface induced dissipation is a major noise source. We believe this can be minimized by producing magnets overhanging the cantilever end. As proof of concept, we will show a 50-nm overhanging cobalt magnet made by a process involving KOH etching, as well as preliminary work on making overhanging magnets by dry fabrication methods. Our current challenge appears to be preventing the formation of metal silicides.

  11. Large deflections of a cantilever beam under arbitrarily directed tip load

    NASA Technical Reports Server (NTRS)

    Mccomb, H. E., Jr.

    1985-01-01

    The nonlinear beam equation was integrated numerically in a direct fashion to obtain results for large deflections of cantilevers under tip loads of arbitrary direction. A short BASIC computer program for performing this integration is presented. Results for selected load cases are presented. The numerical process is performed rapidly on a modern microcomputer, and comparisons with results from closed form solutions show that the process is accurate.

  12. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.

    PubMed

    Grutzik, Scott J; Gates, Richard S; Gerbig, Yvonne B; Smith, Douglas T; Cook, Robert F; Zehnder, Alan T

    2013-11-01

    There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is required. In most cases, the forces of interest are very small, thus compliant cantilevers are used. A number of methods have been developed that are well suited to measuring low stiffness values. However, in some cases a cantilever with much greater stiffness is required. Thus, a direct, traceable method for calibrating very stiff (approximately 200 N/m) cantilevers is presented here. The method uses an instrumented and calibrated nanoindenter to determine the stiffness of a reference cantilever. This reference cantilever is then used to measure the stiffness of a number of AFM test cantilevers. This method is shown to have much smaller uncertainty than previously proposed methods. An example application to fracture testing of nanoscale silicon beam specimens is included.

  13. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers

    SciTech Connect

    Grutzik, Scott J.; Zehnder, Alan T.; Gates, Richard S.; Gerbig, Yvonne B.; Smith, Douglas T.; Cook, Robert F.

    2013-11-15

    There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is required. In most cases, the forces of interest are very small, thus compliant cantilevers are used. A number of methods have been developed that are well suited to measuring low stiffness values. However, in some cases a cantilever with much greater stiffness is required. Thus, a direct, traceable method for calibrating very stiff (approximately 200 N/m) cantilevers is presented here. The method uses an instrumented and calibrated nanoindenter to determine the stiffness of a reference cantilever. This reference cantilever is then used to measure the stiffness of a number of AFM test cantilevers. This method is shown to have much smaller uncertainty than previously proposed methods. An example application to fracture testing of nanoscale silicon beam specimens is included.

  14. Shape effect of torsional resonance mode AFM cantilevers operated in fluids

    NASA Astrophysics Data System (ADS)

    Haochih Liu, Bernard; Chuang, Sheng-Kai; Lowai Huang, Allison

    2014-09-01

    Nanoscale resolution, high scanning rate, and non-destructive measurement are highly desirable attributes for imagining living cells in fluids. Torsional resonance (TR) mode is a promising approach that can satisfy these requirements. In this study, we have fabricated scanning probes with suitable cantilever designs for use in TR mode in fluids, using computer simulation as an aid in the design and fabrication iterations. Several geometrical parameters of cantilevers were considered and simulated for mechanical properties and dynamic characteristics, and selected designs were fabricated for performance evaluation. The influences of design parameters on scan performance were investigated by statistical analysis. Based on this approach, we designed and fabricated optimal cantilevers that can be operated in TR mode in water with high quality (Q) factor (˜60), high resonance frequency (˜240 kHz), and low spring constant (˜0.14 N m-1). Overall, O-shape cantilevers have demonstrated superior Q factors to typical rectangular shape, A-shape and V-shape designs.

  15. Rapid serial prototyping of magnet-tipped attonewton-sensitivity cantilevers by focused ion beam manipulation1

    PubMed Central

    Longenecker, Jonilyn G.; Moore, Eric W.; Marohn, John A.

    2011-01-01

    The authors report a method for rapidly prototyping attonewton-sensitivity cantilevers with custom-fabricated tips and illustrate the method by preparing tips consisting of a magnetic nanorod overhanging the leading edge of the cantilevers. Micron-long nickel nanorods with widths of 120–220 nm were fabricated on silicon chips by electron beam lithography, deposition, and lift-off. Each silicon chip, with its integral nanomagnet, was attached serially to a custom-fabricated attonewton-sensitivity cantilever using focused ion beam manipulation. The magnetic nanorod tips were prepared with and without an alumina capping layer, and the minimum detectable force and tip magnetic moment of the resulting cantilevers was characterized by cantilever magnetometry. The results indicate that this serial but high-yield approach is an effective way to rapidly prepare and characterize magnetic tips for the proposed single-electron-spin and single-proton magnetic resonance imaging experiments. The approach also represents a versatile route for affixing essentially any vacuum-compatible sample to the leading edge of an attonewton-sensitivity cantilever. PMID:23028212

  16. Transverse vibration and buckling of a cantilevered beam with tip body under constant axial base acceleration

    NASA Technical Reports Server (NTRS)

    Storch, J.; Gates, S.

    1983-01-01

    The planar transverse bending behavior of a uniform cantilevered beam with rigid tip body subject to constant axial base acceleration was analyzed. The beam is inextensible and capable of small elastic transverse bending deformations only. Two classes of tip bodies are recognized: (1) mass centers located along the beam tip tangent line; and (2) mass centers with arbitrary offset towards the beam attachment point. The steady state response is studied for the beam end condition cases: free, tip mass, tip body with restricted mass center offset, and tip body with arbitrary mass center offset. The first three cases constitute classical Euler buckling problems, and the characteristic equation for the critical loads/accelerations are determined. For the last case a unique steady state solution exists. The free vibration response is examined for the two classes of tip body. The characteristic equation, eigenfunctions and their orthogonality properties are obtained for the case of restricted mass center offset. The vibration problem is nonhomogeneous for the case of arbitrary mass center offset. The exact solution is obtained as a sum of the steady state solution and a superposition of simple harmonic motions.

  17. Rapid detection of bacterial resistance to antibiotics using AFM cantilevers as nanomechanical sensors

    NASA Astrophysics Data System (ADS)

    Longo, G.; Alonso-Sarduy, L.; Rio, L. Marques; Bizzini, A.; Trampuz, A.; Notz, J.; Dietler, G.; Kasas, S.

    2013-07-01

    The widespread misuse of drugs has increased the number of multiresistant bacteria, and this means that tools that can rapidly detect and characterize bacterial response to antibiotics are much needed in the management of infections. Various techniques, such as the resazurin-reduction assays, the mycobacterial growth indicator tube or polymerase chain reaction-based methods, have been used to investigate bacterial metabolism and its response to drugs. However, many are relatively expensive or unable to distinguish between living and dead bacteria. Here we show that the fluctuations of highly sensitive atomic force microscope cantilevers can be used to detect low concentrations of bacteria, characterize their metabolism and quantitatively screen (within minutes) their response to antibiotics. We applied this methodology to Escherichia coli and Staphylococcus aureus, showing that live bacteria produced larger cantilever fluctuations than bacteria exposed to antibiotics. Our preliminary experiments suggest that the fluctuation is associated with bacterial metabolism.

  18. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  19. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Wagner, R.; Woehl, T. J.; Keller, R. R.; Killgore, J. P.

    2016-07-01

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  20. AFM fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe

    SciTech Connect

    Van Berkel, Gary J.

    2015-06-23

    An electrospray system comprises a liquid extraction surface sampling probe. The probe comprises a probe body having a liquid inlet and a liquid outlet, and having a liquid extraction tip. A solvent delivery conduit is provided for receiving solvent liquid from the liquid inlet and delivering the solvent liquid to the liquid extraction tip. An open liquid extraction channel extends across an exterior surface of the probe body from the liquid extraction tip to the liquid outlet. An electrospray emitter tip is in liquid communication with the liquid outlet of the liquid extraction surface sampling probe. A system for analyzing samples, a liquid junction surface sampling system, and a method of analyzing samples are also disclosed.

  1. Tapping and contact mode imaging of native chromosomes and extraction of genomic DNA using AFM tips

    NASA Astrophysics Data System (ADS)

    Sun, Yingchun; Arakawa, Hideo; Osada, Toshiya; Ikai, Atsushi

    2002-03-01

    It is very important both in medicine and biology to clarify the chromosomal structure to understand its functions. In a standard cytogenetic procedure, chromosomes are often fixed in a mixture of acetic acid and methanol. This process most likely changes the mechanical property of chromosomes. We adopted a method to prepare native and unfixed chromosomes from mouse 3T3 cells and used tapping and contact mode atomic force microscopy (AFM) to image and manipulate them. Modified AFM tips were used to image chromosomes in contact mode in air, and then the chromosome samples were immobilized on a substrate and placed in a buffer solution to pull out DNA-histone complexes from them after they were optimally treated with trypsin. From the AFM images, we could see several bands and granular structures on chromosomes. We obtained force curves indicating long fiber extensions from native chromosomes both with low (in high concentration of NaCl) and high forces (physiological conditions). The result suggested that the degree of chromosome condensation decreased in high concentration of salt. It agrees with the known fact of histone H1 dissociation in a high concentration of salt. We intend to pull out DNA-histone complexes from chromosomes for later molecular operations on them using an AFM.

  2. Theoretical investigation of nonlinear resonances in a carbon nanotube cantilever with a tip-mass under electrostatic excitation

    NASA Astrophysics Data System (ADS)

    Kim, I. K.; Lee, S. I.

    2013-09-01

    The nonlinear dynamics of a resonating carbon nanotube (CNT) cantilever having an attached mass at the tip ("tip mass") were investigated by incorporating electrostatic forces and intermolecular interactions between the CNT and a conducting plane surface. This work enables applications of CNT resonating sensors for tiny mass detection and provides a better understanding of the dynamics of CNT cantilevers. The effect of tip mass on a resonating CNT cantilever is normally characterized by the fundamental frequency shift in the linear resonance regime. However, there are more complex dynamics in the nonlinear resonance regime, such as secondary resonances with parametric excitation. The latter have been limited to nano-cantilevers without tip mass or to axially excited micro-beams. To analyze the nonlinear dynamics, we developed a differential equation model that includes both geometric and inertial nonlinear terms for the large vibration amplitudes at increasing drive forces. In our approach, we used Galerkin discretization techniques and numerical integration methods. The CNT cantilever exhibited complex nonlinear responses due to the applied AC and DC voltages and various tip masses. The nonlinear model had a softer response for increasing tip mass than those of the linear model with the same driving conditions. At low applied voltages, the cantilever had linear amplitude and phase responses at primary and secondary superharmonic resonance frequencies. The response branches were softened at the primary resonance through saddle-node (SN) bifurcation from harmonic electrostatic excitation at higher applied voltages. After SN bifurcation, the lower branch of the solution near resonance became unstable. In addition, theoretical analyses were performed on more complex nonlinear responses and stability changes with tip mass variations, such as period-doubling (PD) bifurcation at subharmonic resonance frequencies.

  3. Effects of Tip Mass on Stability of Rotating Cantilever Pipe Conveying Fluid with Crack

    NASA Astrophysics Data System (ADS)

    Son, In Soo; Yoon, Han Ik; Lee, Sang Pil; Kim, Dong Jin

    In this paper, the dynamic stability of a rotating cantilever pipe conveying fluid with a crack and tip mass is investigated by numerical method. That is, the effects of the rotating the rotating angular velocity, the mass ratio, the crack and tip mass on the critical flow velocity for flutter instability of system are studied. The equations of motion of rotating pipe are derived by using the extended Hamilton's principle. The crack section of pipe is represented by a local flexibility matrix connecting two undamaged pipe segments. The crack is assumed to be in the first mode of fracture and always opened during the vibrations. Finally, the stability maps of the cracked rotating pipe system as a rotating angular velocity and mass ratio β are presented.

  4. Versatile method for AFM-tip functionalization with biomolecules: fishing a ligand by means of an in situ click reaction

    NASA Astrophysics Data System (ADS)

    Kumar, Rakesh; Ramakrishna, Shivaprakash N.; Naik, Vikrant V.; Chu, Zonglin; Drew, Michael E.; Spencer, Nicholas D.; Yamakoshi, Yoko

    2015-04-01

    A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions.A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions. Electronic supplementary information (ESI) available: Experimental details with synthesis and characterization of compounds. Procedures for modifications of Au surfaces and AFM tips. AFM images and full PM-IRRAS spectra of modified surfaces. Detailed procedure for QCM measurement. A table showing ligand-receptor interaction probability. NMR, IR and MS charts. See DOI: 10.1039/c5nr01495f

  5. High throughput nanofabrication of silicon nanowire and carbon nanotube tips on AFM probes by stencil-deposited catalysts.

    PubMed

    Engstrom, Daniel S; Savu, Veronica; Zhu, Xueni; Bu, Ian Y Y; Milne, William I; Brugger, Juergen; Boggild, Peter

    2011-04-13

    A new and versatile technique for the wafer scale nanofabrication of silicon nanowire (SiNW) and multiwalled carbon nanotube (MWNT) tips on atomic force microscope (AFM) probes is presented. Catalyst material for the SiNW and MWNT growth was deposited on prefabricated AFM probes using aligned wafer scale nanostencil lithography. Individual vertical SiNWs were grown epitaxially by a catalytic vapor-liquid-solid (VLS) process and MWNTs were grown by a plasma-enhanced chemical vapor (PECVD) process on the AFM probes. The AFM probes were tested for imaging micrometers-deep trenches, where they demonstrated a significantly better performance than commercial high aspect ratio tips. Our method demonstrates a reliable and cost-efficient route toward wafer scale manufacturing of SiNW and MWNT AFM probes. PMID:21446752

  6. Single-step electropolymerization patterning of a polypyrrole nanowire by ultra-short pulses via an AFM cantilever.

    PubMed

    Nam, Kihwan; Lee, Gyudo; Jung, Huihun; Park, Jinsung; Kim, Chi Hyun; Seo, Jongbum; Yoon, Dae Sung; Lee, Sang Woo; Kwon, Taeyun

    2011-06-01

    Conducting polymers (CPs) have attracted a great deal of attention due to their unique properties; these properties are useful in implementing various functional devices, such as memory, and chemical and biological sensors. In particular, the nanopatterning of CPs is a key technology that will accelerate the adoption of CPs in fabricating nanoscaled multifunctional devices. This paper presents an innovative technique for forming polypyrrole nanowire (PPy-NW) patterns, without any additional pretreatment on the gold surface, using atomic force microscopy (AFM) and ultra-short pulse voltage. Applying the ultra-short pulse voltage to the AFM tip has the following advantage: since the electrochemical current is extremely localized around the tip, the successful formation of CP nanowires results. This is because the pulse width is much shorter than the resistor-capacitor (RC) time constant of the equivalent electrochemical circuit of our experimental set-up. This paper provides systematic results regarding the dimensional variation of the PPy-NW patterns produced by varying the electrical conditions of the ultra-short pulse, such as the pulse amplitude, width, and frequency. The results show that use of an ultra-short pulse is essential in fabricating PPy-NW patterns. Additionally, an ultra-short pulse offers excellent pattern controllability for both width (353 nm ∼ 3.37 µm) and height (2.0 ∼ 88.3 nm).

  7. High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy.

    PubMed

    Cockins, Lynda; Miyahara, Yoichi; Stomp, Romain; Grutter, Peter

    2007-11-01

    We demonstrate a method to fabricate a high-aspect ratio metal tip attached to microfabricated cantilevers with controlled angle, length, and radius, for use in electrostatic force microscopy. A metal wire, after gluing it into a guiding slot that is cut into the cantilever, is shaped into a long, thin tip using a focused ion beam. The high-aspect ratio results in considerable reduction of the capacitive force between tip body and sample when compared to a metal coated pyramidal tip.

  8. Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy.

    PubMed

    Schmutz, Jan-Erik; Schäfer, Marcus M; Hölscher, Hendrik

    2008-02-01

    We present a method how to glue small spheres to atomic force microscope cantilevers. In difference to an often used approach where the sphere is glued to a tipless cantilever, we suggest to mount small spheres to a conventional cantilever with integrated tips modified by a focused ion beam. In this way it is possible to manufacture a spherical probe with increased tip height which enhances the sensitivity in friction force microscopy and reduces the cantilever damping in dynamic force microscopy. By milling cavities for the spheres at the tip apex the colloid particles can be attached at defined positions and contamination with glue can be prevented. PMID:18315335

  9. Whole-Cell Electrical Activity Under Direct Mechanical Stimulus by AFM Cantilever Using Planar Patch Clamp Chip Approach.

    PubMed

    Upadhye, Kalpesh V; Candiello, Joseph E; Davidson, Lance A; Lin, Hai

    2011-06-01

    Patch clamp is a powerful tool for studying the properties of ion-channels and cellular membrane. In recent years, planar patch clamp chips have been fabricated from various materials including glass, quartz, silicon, silicon nitride, polydimethyl-siloxane (PDMS), and silicon dioxide. Planar patch clamps have made automation of patch clamp recordings possible. However, most planar patch clamp chips have limitations when used in combination with other techniques. Furthermore, the fabrication methods used are often expensive and require specialized equipments. An improved design as well as fabrication and characterization of a silicon-based planar patch clamp chip are described in this report. Fabrication involves true batch fabrication processes that can be performed in most common microfabrication facilities using well established MEMS techniques. Our planar patch clamp chips can form giga-ohm seals with the cell plasma membrane with success rate comparable to existing patch clamp techniques. The chip permits whole-cell voltage clamp recordings on variety of cell types including Chinese Hamster Ovary (CHO) cells and pheochromocytoma (PC12) cells, for times longer than most available patch clamp chips. When combined with a custom microfluidics chamber, we demonstrate that it is possible to perfuse the extra-cellular as well as intra-cellular buffers. The chamber design allows integration of planar patch clamp with atomic force microscope (AFM). Using our planar patch clamp chip and microfluidics chamber, we have recorded whole-cell mechanosensitive (MS) currents produced by directly stimulating human keratinocyte (HaCaT) cells using an AFM cantilever. Our results reveal the spatial distribution of MS ion channels and temporal details of the responses from MS channels. The results show that planar patch clamp chips have great potential for multi-parametric high throughput studies of ion channel proteins. PMID:22174731

  10. Tip-surface interactions at redox responsive poly(ferrocenylsilane) (PFS) interface by AFM-based force spectroscopy

    NASA Astrophysics Data System (ADS)

    Chung, Hong Jing; Song, Jing; Vancso, G. Julius

    2009-05-01

    Poly(ferrocenylsilanes) (PFS) belong to the class of redox responsive organometallic polymers. Atomic force microscopy (AFM)-based single molecule force spectroscopy (SMFS) was used earlier to study single chain PFS response and redox energy driven single chain PFS molecular motors. Here we present further AFM investigations of force interactions between tip and a grafted PFS surface under potential control in electrochemical redox cycles. Typical tip-Au interaction is considered as reference in the force measurements. First the electrostatic component in the diffused double layer (DL) in NaClO 4 electrolyte environment was considered for a "grafted to" PFS, which dominated the interplay between the tip and sample surface. The DL forces can also hinder the physisorption of PFS chain onto the tip when the voltage was applied at -0.1 V. On the other hand, if the tip contacted the PFS surface prior to the electrochemical process, physisorption of PFS chains governed the overall interaction regardless of subsequently applied surface potential. In addition, prolonged contact time, tc, may also contribute to the stability of tip-PFS bridging and detection of electrostatic forces between the tip-PFS interface. The results showed that tip-substrate interaction forces without PFS grafts have negligibly small force contributions under similar, electrochemically controlled, conditions used in single PFS chain based molecular motors.

  11. A dynamic model of a cantilever beam with a closed, embedded horizontal crack including local flexibilities at crack tips

    NASA Astrophysics Data System (ADS)

    Liu, J.; Zhu, W. D.; Charalambides, P. G.; Shao, Y. M.; Xu, Y. F.; Fang, X. M.

    2016-11-01

    As one of major failure modes of mechanical structures subjected to periodic loads, embedded cracks due to fatigue can cause catastrophic failure of machineries. Understanding the dynamic characteristics of a structure with an embedded crack is helpful for early crack detection and diagnosis. In this work, a new three-segment beam model with local flexibilities at crack tips is developed to investigate the vibration of a cantilever beam with a closed, fully embedded horizontal crack, which is assumed to be not located at its clamped or free end or distributed near its top or bottom side. The three-segment beam model is assumed to be a linear elastic system, and it does not account for the nonlinear crack closure effect; the top and bottom segments always stay in contact at their interface during the beam vibration. It can model the effects of local deformations in the vicinity of the crack tips, which cannot be captured by previous methods in the literature. The middle segment of the beam containing the crack is modeled by a mechanically consistent, reduced bending moment. Each beam segment is assumed to be an Euler-Bernoulli beam, and the compliances at the crack tips are analytically determined using a J-integral approach and verified using commercial finite element software. Using compatibility conditions at the crack tips and the transfer matrix method, the nature frequencies and mode shapes of the cracked cantilever beam are obtained. The three-segment beam model is used to investigate the effects of local flexibilities at crack tips on the first three natural frequencies and mode shapes of the cracked cantilever beam. A stationary wavelet transform (SWT) method is used to process the mode shapes of the cracked cantilever beam; jumps in single-level SWT decomposition detail coefficients can be used to identify the length and location of an embedded horizontal crack.

  12. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  13. Finite element modeling of atomic force microscopy cantilever dynamics during video rate imaging

    SciTech Connect

    Howard-Knight, J. P.; Hobbs, J. K.

    2011-04-01

    A dynamic finite element model has been constructed to simulate the behavior of low spring constant atomic force microscope (AFM) cantilevers used for imaging at high speed without active feedback as in VideoAFM. The model is tested against experimental data collected at 20 frame/s and good agreement is found. The complex dynamics of the cantilever, consisting of traveling waves coming from the tip sample interaction, reflecting off the cantilever-substrate junction, and interfering with new waves created at the tip, are revealed. The construction of the image from this resulting nonequilibrium cantilever deflection is also examined. Transient tip-sample forces are found to reach values up to 260 nN on a calibration grid sample, and the maximum forces do not always correspond to the position of steepest features as a result of energy stored in the cantilever.

  14. Tensile test of a single nanofiber using an atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Tan, E. P. S.; Goh, C. N.; Sow, C. H.; Lim, C. T.

    2005-02-01

    In this study, an approach using an atomic force microscope (AFM) tip to stretch a single electrospun polyethylene oxide (PEO) nanofiber is demonstrated. One end of the nanofiber is attached to a movable optical microscope stage and the other end of the nanofiber to a piezoresistive AFM cantilever tip. The nanofiber is stretched by moving the microscope stage and the force is measured via the deflection of the cantilever. The elastic modulus of PEO nanofiber is found to be about 45MPa.

  15. AFM probes fabricated with masked maskless combined anisotropic etching and p+ surface doping

    NASA Astrophysics Data System (ADS)

    Han, Jianqiang; Li, Xinxin; Bao, Haifei; Zuo, Guomin; Wang, Yuelin; Feng, Fei; Yu, Zhenyin; Ge, Xiaohong

    2006-02-01

    The paper presents a newly developed high-yield micro-fabrication technology for single-crystalline silicon atomic force microscope (AFM) probes. Both the tips and the cantilevers are simultaneously formed by a masked-maskless combined anisotropic etching process. Compared to a conventional tip-to-cantilever sequential fabrication scheme, this tip-and-cantilever simultaneous formation can effectively increase fabrication yield by avoiding the tips damaged during the following processed photolithographic steps for defining the cantilevers. By heavy boron doping at the surface, the conductive AFM probe provides an electrical path to the electric ground of the AFM that helps to eliminate the electrostatic accumulation of charges and, therefore, eliminate undesirable electrostatic forces between the probes and the samples. A fabrication yield as high as 90% has been obtained for the AFM probes for 4 inch wafers. The tips after oxidation-sharpening treatment generally have a radius of 10-30 nm. The cantilever spring constant can be well controlled in the range of 0.025-40 N m-1. High-quality sample scanning results with the formed AFM probes are obtained with a slightly better resolution than that from commercial probes without surface conductive treatment.

  16. Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms.

    PubMed

    Makasheva, K; Villeneuve-Faure, C; Laurent, C; Despax, B; Boudou, L; Teyssedre, G

    2015-07-24

    The study of charge distribution on the surface and in the bulk of dielectrics is of great scientific interest because of the information gained on the storage and transport properties of the medium. Nevertheless, the processes at the nanoscale level remain out of the scope of the commonly used diagnostic methods. Atomic force microscopy (AFM) is currently applied for both injection and imaging of charges on dielectric thin films at the nanoscale level to answer the increasing demand for characterization of miniaturized components used in microelectronics, telecommunications, electrophotography, electrets, etc. However, the mechanisms for dielectric charging by AFM are not well documented, and an analysis of the literature shows that inappropriate mechanisms are sometimes presented. It is shown here that corona discharge, frequently pointed out as a likely mechanism for dielectric charging by AFM in tip-to-sample space mode, cannot develop in such small distances. Furthermore, a review of different mechanisms surmised to be at the origin of dielectric charging at the nanoscale level is offered. Field electron emission enhanced by thermionic emission is identified as a likely mechanism for dielectric charging at the nanoscale level. Experimental validation of this mechanism is obtained for typical electric field strengths in AFM. PMID:26133237

  17. Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms

    NASA Astrophysics Data System (ADS)

    Makasheva, K.; Villeneuve-Faure, C.; Laurent, C.; Despax, B.; Boudou, L.; Teyssedre, G.

    2015-07-01

    The study of charge distribution on the surface and in the bulk of dielectrics is of great scientific interest because of the information gained on the storage and transport properties of the medium. Nevertheless, the processes at the nanoscale level remain out of the scope of the commonly used diagnostic methods. Atomic force microscopy (AFM) is currently applied for both injection and imaging of charges on dielectric thin films at the nanoscale level to answer the increasing demand for characterization of miniaturized components used in microelectronics, telecommunications, electrophotography, electrets, etc. However, the mechanisms for dielectric charging by AFM are not well documented, and an analysis of the literature shows that inappropriate mechanisms are sometimes presented. It is shown here that corona discharge, frequently pointed out as a likely mechanism for dielectric charging by AFM in tip-to-sample space mode, cannot develop in such small distances. Furthermore, a review of different mechanisms surmised to be at the origin of dielectric charging at the nanoscale level is offered. Field electron emission enhanced by thermionic emission is identified as a likely mechanism for dielectric charging at the nanoscale level. Experimental validation of this mechanism is obtained for typical electric field strengths in AFM.

  18. Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Akiyama, T.; Staufer, U.; de Rooij, N. F.; Frederix, P.; Engel, A.

    2003-01-01

    A self-sensing and -actuating probe for dynamic mode atomic force microscopy (AFM) based on a commercial quartz tuning fork and a microfabricated cantilever is presented. The U-shaped cantilever, exhibiting a sharp tip, is combined with the tuning fork in a symmetrical arrangement, such that each of the two legs of the cantilever is fixed to one of the prongs of the tuning fork. The tuning fork is used as an oscillatory force sensor. Its frequency and amplitude govern that of the tip vibration, while the cantilever determines the spring constant of the whole probe. The frequency of the tip vibration for AFM operations can be much higher than the resonance frequency of the cantilever. A probe comprising a silicon nitride cantilever (0.1 N/m) is used to image monoatomic terraces of graphite in the intermittent contact mode. A much softer cantilever (0.01 N/m) is used to analyze the topography of a microelectronic chip in the same mode. Moreover, a bacterial surface layer hexagonally packed intermediate layer of Deinococcus radiodurans is imaged in a buffer solution. The tip vibration was again generated by the tuning fork while the sample interaction was measured using the standard optical detection scheme in this experiment. These probes are suited for batch fabrication and assembly and, therefore, enlarge the applications for the tuning fork based AFM.

  19. Integrin-Specific Mechanoresponses to Compression and Extension Probed by Cylindrical Flat-Ended AFM Tips in Lung Cells

    PubMed Central

    Acerbi, Irene; Luque, Tomás; Giménez, Alícia; Puig, Marta; Reguart, Noemi; Farré, Ramon; Navajas, Daniel; Alcaraz, Jordi

    2012-01-01

    Cells from lung and other tissues are subjected to forces of opposing directions that are largely transmitted through integrin-mediated adhesions. How cells respond to force bidirectionality remains ill defined. To address this question, we nanofabricated flat-ended cylindrical Atomic Force Microscopy (AFM) tips with ∼1 µm2 cross-section area. Tips were uncoated or coated with either integrin-specific (RGD) or non-specific (RGE/BSA) molecules, brought into contact with lung epithelial cells or fibroblasts for 30 s to form focal adhesion precursors, and used to probe cell resistance to deformation in compression and extension. We found that cell resistance to compression was globally higher than to extension regardless of the tip coating. In contrast, both tip-cell adhesion strength and resistance to compression and extension were the highest when probed at integrin-specific adhesions. These integrin-specific mechanoresponses required an intact actin cytoskeleton, and were dependent on tyrosine phosphatases and Ca2+ signaling. Cell asymmetric mechanoresponse to compression and extension remained after 5 minutes of tip-cell adhesion, revealing that asymmetric resistance to force directionality is an intrinsic property of lung cells, as in most soft tissues. Our findings provide new insights on how lung cells probe the mechanochemical properties of the microenvironment, an important process for migration, repair and tissue homeostasis. PMID:22384196

  20. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    SciTech Connect

    Haemmerli, Alexandre J.; Pruitt, Beth L.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David

    2015-07-21

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz–10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  1. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    NASA Astrophysics Data System (ADS)

    Haemmerli, Alexandre J.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David; Pruitt, Beth L.

    2015-07-01

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz-10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  2. Comment on ‘Longest reach of a cantilever with a tip load’

    NASA Astrophysics Data System (ADS)

    Batista, Milan

    2016-09-01

    In this contribution, the longest horizontal reach of a cantilever subject to a dead load is analysed in terms of Jacobi elliptical functions. The problem is reduced to finding the solution of a system of transcendental equations. Several analytical results that cannot be obtained using pure numerical methods are discussed.

  3. Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting

    NASA Astrophysics Data System (ADS)

    Sang, Hongqian; Jarvis, Samuel P.; Zhou, Zhichao; Sharp, Peter; Moriarty, Philip; Wang, Jianbo; Wang, Yu; Kantorovich, Lev

    2014-10-01

    A practical experimental strategy is proposed that could potentially enable greater control of the tip apex in non-contact atomic force microscopy experiments. It is based on a preparation of a structure of interest alongside a reference surface reconstruction on the same sample. Our proposed strategy is as follows. Spectroscopy measurements are first performed on the reference surface to identify the tip apex structure using a previously collected database of responses of different tips to this surface. Next, immediately following the tip identification protocol, the surface of interest is studied (imaging, manipulation and/or spectroscopy). The prototype system we choose is the mixed Si(111)-7×7 and surface which can be prepared on the same sample with a controlled ratio of reactive and passivated regions. Using an ``in silico'' approach based on ab initio density functional calculations and a set of tips with varying chemical reactivities, we show how one can perform tip fingerprinting using the Si(111)-7×7 reference surface. Then it is found by examining the imaging of a naphthalene tetracarboxylic diimide (NTCDI) molecule adsorbed on surface that negatively charged tips produce the best intramolecular contrast attributed to the enhancement of repulsive interactions.

  4. In-situ piezoresponse force microscopy cantilever mode shape profiling

    SciTech Connect

    Proksch, R.

    2015-08-21

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  5. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    NASA Astrophysics Data System (ADS)

    Balantekin, M.; Satır, S.; Torello, D.; Deǧertekin, F. L.

    2014-12-01

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  6. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect

    Balantekin, M.; Satır, S.; Torello, D.; Değertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  7. Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control

    NASA Astrophysics Data System (ADS)

    Fairbairn, M.; Moheimani, S. O. R.

    2013-05-01

    The image quality and resolution of the Atomic Force Microscope (AFM) operating in tapping mode is dependent on the quality (Q) factor of the sensing micro-cantilever. Increasing the cantilever Q factor improves image resolution and reduces the risk of sample and cantilever damage. Active piezoelectric shunt control is introduced in this work as a new technique for modifying the Q factor of a piezoelectric self-actuating AFM micro-cantilever. An active impedance is placed in series with the tip oscillation voltage source to modify the mechanical dynamics of the cantilever. The benefit of using this control technique is that it removes the optical displacement sensor from the Q control feedback loop to reduce measurement noise in the loop and allows for a reduction in instrument size.

  8. Accurate flexural spring constant calibration of colloid probe cantilevers using scanning laser Doppler vibrometry.

    PubMed

    Gates, Richard S; Osborn, William A; Shaw, Gordon A

    2015-06-12

    Calibration of the flexural spring constant for atomic force microscope (AFM) colloid probe cantilevers provides significant challenges. The presence of a large attached spherical added mass complicates many of the more common calibration techniques such as reference cantilever, Sader, and added mass. Even the most promising option, AFM thermal calibration, can encounter difficulties during the optical lever sensitivity measurement due to strong adhesion and friction between the sphere and a surface. This may cause buckling of the end of the cantilever and hysteresis in the approach-retract curves resulting in increased uncertainty in the calibration. Most recently, a laser Doppler vibrometry thermal method has been used to accurately calibrate the normal spring constant of a wide variety of tipped and tipless commercial cantilevers. This paper describes a variant of the technique, scanning laser Doppler vibrometry, optimized for colloid probe cantilevers and capable of spring constant calibration uncertainties near ±1%.

  9. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips.

    PubMed

    Valdrè, Giovanni; Moro, Daniele

    2008-10-01

    The investigation of the nanoscale distribution of electrostatic forces on material surfaces is of paramount importance for the development of nanotechnology, since these confined forces govern many physical processes on which a large number of technological applications are based. For instance, electric force microscopy (EFM) and micro-electro-mechanical-systems (MEMS) are technologies based on an electrostatic interaction between a cantilever and a specimen. In the present work we report on a 3D finite element analysis of the electrostatic deflection of cantilevers for electric and Kelvin force microscopy. A commercial triangular shaped cantilever with a symmetric pyramidal tip was modelled. In addition, the cantilever was modified by a focused ion beam (FIB) in order to reduce its parasitic electrostatic force, and its behaviour was studied by computation analysis. 3D modelling of the electrostatic deflection was realized by using a multiphysics finite element analysis software and it was applied to the real geometry of the cantilevers and probes obtained by using basic CAD tools. The results of the modelling are in good agreement with experimental data.

  10. Large-Scale Fabrication of Carbon Nanotube Probe Tips For Atomic Force Microscopy Critical Dimension Imaging Applications

    NASA Technical Reports Server (NTRS)

    Ye, Qi Laura; Cassell, Alan M.; Stevens, Ramsey M.; Meyyappan, Meyya; Li, Jun; Han, Jie; Liu, Hongbing; Chao, Gordon

    2004-01-01

    Carbon nanotube (CNT) probe tips for atomic force microscopy (AFM) offer several advantages over Si/Si3N4 probe tips, including improved resolution, shape, and mechanical properties. This viewgraph presentation discusses these advantages, and the drawbacks of existing methods for fabricating CNT probe tips for AFM. The presentation introduces a bottom up wafer scale fabrication method for CNT probe tips which integrates catalyst nanopatterning and nanomaterials synthesis with traditional silicon cantilever microfabrication technology. This method makes mass production of CNT AFM probe tips feasible, and can be applied to the fabrication of other nanodevices with CNT elements.

  11. Atomic force microscope cantilever calibration using a focused ion beam.

    PubMed

    Slattery, Ashley D; Quinton, Jamie S; Gibson, Christopher T

    2012-07-20

    A calibration method is presented for determining the spring constant of atomic force microscope (AFM) cantilevers, which is a modification of the established Cleveland added mass technique. A focused ion beam (FIB) is used to remove a well-defined volume from a cantilever with known density, substantially reducing the uncertainty usually present in the added mass method. The technique can be applied to any type of AFM cantilever; but for the lowest uncertainty it is best applied to silicon cantilevers with spring constants above 0.7 N m(-1), where uncertainty is demonstrated to be typically between 7 and 10%. Despite the removal of mass from the cantilever, the calibration method presented does not impair the probes' ability to acquire data. The technique has been extensively tested in order to verify the underlying assumptions in the method. This method was compared to a number of other calibration methods and practical improvements to some of these techniques were developed, as well as important insights into the behavior of FIB modified cantilevers. These results will prove useful to research groups concerned with the application of microcantilevers to nanoscience, in particular for cases where maintaining pristine AFM tip condition is critical.

  12. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid.

    PubMed

    Miyazawa, K; Izumi, H; Watanabe-Nakayama, T; Asakawa, H; Fukuma, T

    2015-03-13

    Recently, possibilities of improving operation speed and force sensitivity in atomic-scale atomic force microscopy (AFM) in liquid using a small cantilever with an electron beam deposited (EBD) tip have been intensively explored. However, the structure and properties of an EBD tip suitable for such an application have not been well-understood and hence its fabrication process has not been established. In this study, we perform atomic-scale AFM measurements with a small cantilever and clarify two major problems: contaminations from a cantilever and tip surface, and insufficient mechanical strength of an EBD tip having a high aspect ratio. To solve these problems, here we propose a fabrication process of an EBD tip, where we attach a 2 μm silica bead at the cantilever end and fabricate a 500-700 nm EBD tip on the bead. The bead height ensures sufficient cantilever-sample distance and enables to suppress long-range interaction between them even with a short EBD tip having high mechanical strength. After the tip fabrication, we coat the whole cantilever and tip surface with Si (30 nm) to prevent the generation of contamination. We perform atomic-scale AFM imaging and hydration force measurements at a mica-water interface using the fabricated tip and demonstrate its applicability to such an atomic-scale application. With a repeated use of the proposed process, we can reuse a small cantilever for atomic-scale measurements for several times. Therefore, the proposed method solves the two major problems and enables the practical use of a small cantilever in atomic-scale studies on various solid-liquid interfacial phenomena.

  13. AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects.

    PubMed

    Fresco, Zachary M; Suez, Itai; Backer, Scott A; Fréchet, Jean M J

    2004-07-14

    An alpha,alpha-dimethyl-3,5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios.

  14. Solid-state SiO2 nano-gears AFM tip manipulation on HOPG

    NASA Astrophysics Data System (ADS)

    Yang, Jianshu; Deng, Jie; Troadec, Cedic; Ondarçuhu, Thierry; Joachim, Christian

    2014-11-01

    On a native graphite surface, 15 nm-thick solid-state nanogears are nanofabricated with a 30 nm outer diameter and six teeth. The nanogears are manipulated one at a time by the tip of an atomic force microscope using the sample stage displacements for the manipulation and recording of the corresponding manipulation signals. For step heights below 3.0 nm, nanogears are manipulated up and down native graphite surface step edges. In the absence of a central shaft per nanogear, gearing between nanogears is limited to a few 1/12 turns for six teeth. When the graphite step is higher than 3 nm, a rack-and-pinion mechanism was constructed along the edge with a 90 nm nanogear pinion.

  15. Solid-state SiO₂ nano-gears AFM tip manipulation on HOPG.

    PubMed

    Yang, Jianshu; Deng, Jie; Troadec, Cedic; Ondarçuhu, Thierry; Joachim, Christian

    2014-11-21

    On a native graphite surface, 15 nm-thick solid-state nanogears are nanofabricated with a 30 nm outer diameter and six teeth. The nanogears are manipulated one at a time by the tip of an atomic force microscope using the sample stage displacements for the manipulation and recording of the corresponding manipulation signals. For step heights below 3.0 nm, nanogears are manipulated up and down native graphite surface step edges. In the absence of a central shaft per nanogear, gearing between nanogears is limited to a few 1/12 turns for six teeth. When the graphite step is higher than 3 nm, a rack-and-pinion mechanism was constructed along the edge with a 90 nm nanogear pinion.

  16. Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

    PubMed Central

    2013-01-01

    Abstract A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS 07.79.Lh, 81.16.-c, 84.37. + q PMID:24314111

  17. Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner.

    PubMed

    Lu, Lu; Xu, Song; Zhang, Donghui; Garno, Jayne C

    2016-03-01

    Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information. The FMM mode is useful for investigations with polymer and organic thin film samples. Qualitative evaluation of the mixed domains of co-polymers or composite films can often be accomplished with high resolution using FMM phase and amplitude images. We have designed and tested a sample stage for FMM constructed of machined polycarbonate. A generic design enables FMM experiments for instrument configurations with a tip-mounted SPM scanner. A piezoactuator within the sample stage was used to drive the sample to vibrate in the z-direction according to selected parameters. To evaluate the FMM sample stage, we tested samples of known composition with nanoscale dimensions for increasingly complex surface morphologies. Excellent resolution was achieved in ambient conditions using the home-constructed sample stage, as revealed for complex surfaces or multi-component samples. Test structures of nanoholes within a film of organosilanes provided the simplest platform with two distinct surface domains. Ring-shaped nanostructures prepared on Si(111) with mixed organosilanes provided three regions for evaluating FMM results. A complex sample consisting of a cyclic gel polymer containing fibril nanostructures was also tested with FMM measurements. Frequency spectra were acquired for sample domains, revealing distinct differences in local mechanical response. We demonstrate a practical approach to construct a sample stage accessory to facilitate z-sample modulation for FMM experiments with tip-mounted SPM scanners. PMID:26824091

  18. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition

    SciTech Connect

    Kinoshita, Yukinori; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2011-11-15

    Tungsten (W) is significantly suitable as a tip material for atomic force microscopy (AFM) because its high mechanical stiffness enables the stable detection of tip-sample interaction forces. We have developed W sputter-coating equipment to compensate the drawbacks of conventional Si cantilever tips used in AFM measurements. By employing an ion gun commonly used for sputter cleaning of a cantilever tip, the equipment is capable of depositing conductive W films in the preparation chamber of a general ultrahigh vacuum (UHV)-AFM system without the need for an additional chamber or transfer system. This enables W coating of a cantilever tip immediately after sputter cleaning of the tip apex and just before the use in AFM observations. The W film consists of grain structures, which prevent tip dulling and provide sharpness (<3 nm in radius of curvature at the apex) comparable to that of the original Si tip apex. We demonstrate that in non-contact (NC)-AFM measurement, a W-coated Si tip can clearly resolve the atomic structures of a Ge(001) surface without any artifacts, indicating that, as a force sensor, the fabricated W-coated Si tip is superior to a bare Si tip.

  19. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition.

    PubMed

    Kinoshita, Yukinori; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2011-11-01

    Tungsten (W) is significantly suitable as a tip material for atomic force microscopy (AFM) because its high mechanical stiffness enables the stable detection of tip-sample interaction forces. We have developed W sputter-coating equipment to compensate the drawbacks of conventional Si cantilever tips used in AFM measurements. By employing an ion gun commonly used for sputter cleaning of a cantilever tip, the equipment is capable of depositing conductive W films in the preparation chamber of a general ultrahigh vacuum (UHV)-AFM system without the need for an additional chamber or transfer system. This enables W coating of a cantilever tip immediately after sputter cleaning of the tip apex and just before the use in AFM observations. The W film consists of grain structures, which prevent tip dulling and provide sharpness (<3 nm in radius of curvature at the apex) comparable to that of the original Si tip apex. We demonstrate that in non-contact (NC)-AFM measurement, a W-coated Si tip can clearly resolve the atomic structures of a Ge(001) surface without any artifacts, indicating that, as a force sensor, the fabricated W-coated Si tip is superior to a bare Si tip.

  20. Piezoelectric cantilever sensors

    NASA Technical Reports Server (NTRS)

    Shih, Wan Y. (Inventor); Shih, Wei-Heng (Inventor); Shen, Zuyan (Inventor)

    2008-01-01

    A piezoelectric cantilever with a non-piezoelectric, or piezoelectric tip useful as mass and viscosity sensors. The change in the cantilever mass can be accurately quantified by monitoring a resonance frequency shift of the cantilever. For bio-detection, antibodies or other specific receptors of target antigens may be immobilized on the cantilever surface, preferably on the non-piezoelectric tip. For chemical detection, high surface-area selective absorbent materials are coated on the cantilever tip. Binding of the target antigens or analytes to the cantilever surface increases the cantilever mass. Detection of target antigens or analytes is achieved by monitoring the cantilever's resonance frequency and determining the resonance frequency shift that is due to the mass of the adsorbed target antigens on the cantilever surface. The use of a piezoelectric unimorph cantilever allows both electrical actuation and electrical sensing. Incorporating a non-piezoelectric tip (14) enhances the sensitivity of the sensor. In addition, the piezoelectric cantilever can withstand damping in highly viscous liquids and can be used as a viscosity sensor in wide viscosity range.

  1. Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy.

    PubMed

    Deng, Wenqi; Zhang, Guang-Ming; Murphy, Mark F; Lilley, Francis; Harvey, David M; Burton, David R

    2015-10-01

    Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behavior of tapping mode AFM has been investigated using mathematical modeling, comprehensive understanding of the behavior of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever's dynamic behavior in tapping mode AFM is studied through a three dimensional finite element method. The cantilever's dynamic displacement responses are firstly obtained via simulation under different tip-sample separations, and for different tip-sample interaction forces, such as elastic force, adhesion force, viscosity force, and the van der Waals force, which correspond to the cantilever's action upon various different representative computer-generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone, and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude, and frequency changes are then analyzed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations. PMID:26303510

  2. Mode coupling in a hanging-fiber AFM used as a rheological probe

    NASA Astrophysics Data System (ADS)

    Devailly, C.; Laurent, J.; Steinberger, A.; Bellon, L.; Ciliberto, S.

    2014-06-01

    We analyze the advantages and drawbacks of a method which measures the viscosity of liquids at microscales, using a thin glass fiber fixed on the tip of a cantilever of an ultra-low-noise Atomic Force Microscope (AFM). When the fiber is dipped into a liquid, the dissipation of the cantilever-fiber system, which is linked to the liquid viscosity, can be computed from the power spectral density of the thermal fluctuations of the cantilever deflection. The high sensitivity of the AFM allows us to show the existence and to develop a model of the coupling between the dynamics of the fiber and that of the cantilever. This model, which accurately fits the experimental data, gives also more insights into the dynamics of coupled microdevices in a viscous environment.

  3. A direct micropipette-based calibration method for atomic force microscope cantilevers

    PubMed Central

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes. PMID:19566228

  4. AFM nanoscale indentation in air of polymeric and hybrid materials with highly different stiffness

    NASA Astrophysics Data System (ADS)

    Suriano, Raffaella; Credi, Caterina; Levi, Marinella; Turri, Stefano

    2014-08-01

    In this study, nanomechanical properties of a variety of polymeric materials was investigated by means of AFM. In particular, selecting different AFM probes, poly(methyl methacrylate) (PMMA), polydimethylsiloxane (PDMS) bulk samples, sol-gel hybrid thin films and hydrated hyaluronic acid hydrogels were indented in air to determine the elastic modulus. The force-distance curves and the indentation data were found to be greatly affected by the cantilever stiffness and by tip geometry. AFM indentation tests show that the choice of the cantilever spring constant and of tip shape is crucially influenced by elastic properties of samples. When adhesion-dominated interactions occur between the tip and the surface of samples, force-displacement curves reveal that a suitable functionalization of AFM probes allows the control of such interactions and the extraction of Young' modulus from AFM curves that would be otherwise unfeasible. By applying different mathematical models depending on AFM probes and materials under investigation, the values of Young's modulus were obtained and compared to those measured by rheological and dynamic mechanical analysis or to literature data. Our results show that a wide range of elastic moduli (10 kPa-10 GPa) can be determined by AFM in good agreement with those measured by conventional macroscopic measurements.

  5. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process.

    PubMed

    Villeneuve-Faure, C; Makasheva, K; Boudou, L; Teyssedre, G

    2016-06-17

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms. PMID:27158768

  6. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process

    NASA Astrophysics Data System (ADS)

    Villeneuve-Faure, C.; Makasheva, K.; Boudou, L.; Teyssedre, G.

    2016-06-01

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms.

  7. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process.

    PubMed

    Villeneuve-Faure, C; Makasheva, K; Boudou, L; Teyssedre, G

    2016-06-17

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms.

  8. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.

    PubMed

    Gates, Richard S; Reitsma, Mark G

    2007-08-01

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  9. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

    SciTech Connect

    Gates, Richard S.; Reitsma, Mark G.

    2007-08-15

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  10. Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes.

    PubMed

    Smirnov, Waldemar; Kriele, Armin; Hoffmann, René; Sillero, Eugenio; Hees, Jakob; Williams, Oliver A; Yang, Nianjun; Kranz, Christine; Nebel, Christoph E

    2011-06-15

    In atomic force microscopy (AFM), sharp and wear-resistant tips are a critical issue. Regarding scanning electrochemical microscopy (SECM), electrodes are required to be mechanically and chemically stable. Diamond is the perfect candidate for both AFM probes as well as for electrode materials if doped, due to diamond's unrivaled mechanical, chemical, and electrochemical properties. In this study, standard AFM tips were overgrown with typically 300 nm thick nanocrystalline diamond (NCD) layers and modified to obtain ultra sharp diamond nanowire-based AFM probes and probes that were used for combined AFM-SECM measurements based on integrated boron-doped conductive diamond electrodes. Analysis of the resonance properties of the diamond overgrown AFM cantilevers showed increasing resonance frequencies with increasing diamond coating thicknesses (i.e., from 160 to 260 kHz). The measured data were compared to performed simulations and show excellent correlation. A strong enhancement of the quality factor upon overgrowth was also observed (120 to 710). AFM tips with integrated diamond nanowires are shown to have apex radii as small as 5 nm and where fabricated by selectively etching diamond in a plasma etching process using self-organized metal nanomasks. These scanning tips showed superior imaging performance as compared to standard Si-tips or commercially available diamond-coated tips. The high imaging resolution and low tip wear are demonstrated using tapping and contact mode AFM measurements by imaging ultra hard substrates and DNA. Furthermore, AFM probes were coated with conductive boron-doped and insulating diamond layers to achieve bifunctional AFM-SECM probes. For this, focused ion beam (FIB) technology was used to expose the boron-doped diamond as a recessed electrode near the apex of the scanning tip. Such a modified probe was used to perform proof-of-concept AFM-SECM measurements. The results show that high-quality diamond probes can be fabricated, which are

  11. New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy

    NASA Astrophysics Data System (ADS)

    Dai, G.; Hässler-Grohne, W.; Hüser, D.; Wolff, H.; Fluegge, J.; Bosse, H.

    2011-06-01

    A new 3D-AFM for true 3D measurements of nano structures has been developed at Physikalisch Technische-Bundesanstalt, the national metrology institute of Germany. In its configuration, two piezo actuators are applied to drive the AFM cantilever near its vertical and torsional resonant frequencies. In such a way, the AFM tip can probe the surface with a vertical and/or a lateral oscillation, offering high 3D probing sensitivity. For enhancing measurement flexibility as well as reducing tip wear, a so called "vector approach probing" (VAP) method has been applied. The sample is measured point by point using this method. At each probing point, the tip is approached towards the surface in its normal direction until the desired tip-sample interaction is detected and then immediately withdrawn from the surface. Preliminary experimental results show promising performance of the developed system. The measurement of a line structure of 800 nm height employing a super sharp AFM tip is performed, showing a repeatability of its 3D profiles of better than 1 nm (p-v). A single crystal critical dimension reference material (SCCDRM) having features with almost vertical sidewall is measured using a flared AFM tip. Results show that the feature has averaged left and right sidewall angles of 88.64° and 88.67deg;, respectively. However, the feature width non-uniformity may reach 10 nm within the measurement range of 1 μm. The standard deviation of the averaged middle CD values of 7 repeated measurements reaches 0.35 nm. In addition, an investigation of long term measurement stability is performed on a PTB photomask. The results shows that the 3D-AFM has a drift rate of about 0.00033 nm per line, which confirms the high measurement stability and the very low tip wear.

  12. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model. PMID:27420398

  13. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  14. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever

    NASA Astrophysics Data System (ADS)

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M.

    2016-09-01

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  15. Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi

    2016-08-01

    In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. Both optical and mechanical detection techniques were adopted in SNOM to detect scattered light induced by the interaction of the PZT cantilever tip apex and evanescent light, and SNOM images were obtained for each detection scheme. The mechanical detection technique did allow for a clear observation of the light scattered from the PZT cantilever without the interference observed by the optical detection technique, which used an objective lens, a pinhole, and a photomultiplier tube.

  16. Viscous drag measurements utilizing microfabricated cantilevers

    SciTech Connect

    Oden, P.I.; Chen, G.Y.; Steele, R.A.; Warmack, R.J.; Thundat, T.

    1996-06-01

    The influence of viscous drag forces on cantilevers is investigated using standard atomic force microscope (AFM) cantilevers. Viscosity effects on several geometrically different cantilevers manifest themselves as variations in resonance frequencies, quality factors, and cantilever response amplitudes. With this novel measurement, a single cantilever can be used to measure viscosities ranging from {eta}=10{sup {minus}2} to 10{sup 2} g/cms. {copyright} {ital 1996 American Institute of Physics.}

  17. Control of curvature in highly compliant probe cantilevers during carbon nanotube growth.

    PubMed

    Chen, I-Chen; Chen, Li-Han; Orme, Christine A; Jin, Sungho

    2007-10-01

    Direct growth of a sharp carbon nanotube (CNT) probe on a very thin and highly flexible cantilever by plasma-enhanced chemical vapor deposition (PECVD) is desirable for atomic force microscopy (AFM) of nanoscale features on soft or fragile materials. Plasma-induced surface stresses in such fabrication processes, however, tend to cause serious bending of these cantilevers, which makes the CNT probe unsuitable for AFM measurements. Here, we report a new tunable CNT growth technique that controls cantilever bending during deposition, thereby enabling the creation of either flat or deliberately curved AFM cantilevers containing a CNT probe. By introducing hydrogen gas to the (acetylene + ammonia) feed gas during CNT growth and adjusting the ammonia to hydrogen flow ratio, the cantilever surface stress can be altered from compressive to tensile stress, and in doing so controlling the degree of cantilever bending. The CNT probes grown under these conditions have high aspect ratios and are robust. Contact-mode imaging has been demonstrated using these probe tips. Such CNT probes can be useful for bio-imaging involving DNA and other delicate biological features in a liquid environment. PMID:17887798

  18. Carbon nanotube/carbon nanotube composite AFM probes prepared using ion flux molding

    NASA Astrophysics Data System (ADS)

    Chesmore, Grace; Roque, Carrollyn; Barber, Richard

    The performance of carbon nanotube-carbon nanotube composite (CNT/CNT composite) atomic force microscopy (AFM) probes is compared to that of conventional Si probes in AFM tapping mode. The ion flux molding (IFM) process, aiming an ion beam at the CNT probe, aligns the tip to a desired angle. The result is a relatively rigid tip that is oriented to offset the cantilever angle. Scans using these probes reveal an improvement in image accuracy over conventional tips, while allowing higher aspect ratio imaging of 3D surface features. Furthermore, the lifetimes of CNT-CNT composite tips are observed to be longer than both conventional tips and those claimed for other CNT technologies. Novel applications include the imaging of embiid silk. Supported by the Clare Boothe Luce Research Scholars Award and Carbon Design Innovations.

  19. Compact metal probes: a solution for atomic force microscopy based tip-enhanced Raman spectroscopy.

    PubMed

    Rodriguez, R D; Sheremet, E; Müller, S; Gordan, O D; Villabona, A; Schulze, S; Hietschold, M; Zahn, D R T

    2012-12-01

    There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

  20. Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

    NASA Astrophysics Data System (ADS)

    Rodriguez, R. D.; Sheremet, E.; Müller, S.; Gordan, O. D.; Villabona, A.; Schulze, S.; Hietschold, M.; Zahn, D. R. T.

    2012-12-01

    There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

  1. Development of a 3D-AFM for true 3D measurements of nanostructures

    NASA Astrophysics Data System (ADS)

    Dai, Gaoliang; Häßler-Grohne, Wolfgang; Hüser, Dorothee; Wolff, Helmut; Danzebrink, Hans-Ulrich; Koenders, Ludger; Bosse, Harald

    2011-09-01

    The development of advanced lithography requires highly accurate 3D metrology methods for small line structures of both wafers and photomasks. Development of a new 3D atomic force microscopy (3D-AFM) with vertical and torsional oscillation modes is introduced in this paper. In its configuration, the AFM probe is oscillated using two piezo actuators driven at vertical and torsional resonance frequencies of the cantilever. In such a way, the AFM tip can probe the surface with a vertical and a lateral oscillation, offering high 3D probing sensitivity. In addition, a so-called vector approach probing (VAP) method has been applied. The sample is measured point-by-point using this method. At each probing point, the tip is approached towards the surface until the desired tip-sample interaction is detected and then immediately withdrawn from the surface. Compared to conventional AFMs, where the tip is kept continuously in interaction with the surface, the tip-sample interaction time using the VAP method is greatly reduced and consequently the tip wear is reduced. Preliminary experimental results show promising performance of the developed system. A measurement of a line structure of 800 nm height employing a super sharp AFM tip could be performed with a repeatability of its 3D profiles of better than 1 nm (p-v). A line structure of a Physikalisch-Technische Bundesanstalt photomask with a nominal width of 300 nm has been measured using a flared tip AFM probe. The repeatability of the middle CD values reaches 0.28 nm (1σ). A long-term stability investigation shows that the 3D-AFM has a high stability of better than 1 nm within 197 measurements taken over 30 h, which also confirms the very low tip wear.

  2. Cantilevered carbon nanotube hygrometer

    NASA Astrophysics Data System (ADS)

    Kuroyanagi, Toshinori; Terada, Yuki; Takei, Kuniharu; Akita, Seiji; Arie, Takayuki

    2014-05-01

    We investigate the effects of humidity on the vibrations of carbon nanotubes (CNTs) using two types of CNT cantilevers: open-ended and close-ended CNT cantilevers. As the humidity increases, the resonant frequency of the open-ended CNT cantilever decreases due to the adsorption of water molecules onto the CNT tip, whereas that of the close-ended CNT cantilever increases probably due to the change in the viscosity of the air surrounding the CNT cantilever, which is negatively correlated with the humidity of air. Our findings suggest that a close-ended CNT cantilever is more suitable for a quick-response and ultrasensitive hygrometer because it continuously reads the viscosity change of moist air in the vicinity of the CNT.

  3. Detailed Observation of Multiphoton Emission Enhancement from a Single Colloidal Quantum Dot Using a Silver-Coated AFM Tip.

    PubMed

    Takata, Hiroki; Naiki, Hiroyuki; Wang, Li; Fujiwara, Hideki; Sasaki, Keiji; Tamai, Naoto; Masuo, Sadahiro

    2016-09-14

    The enhancement of multiphoton emission from a single colloidal nanocrystal quantum dot (NQD) interacting with a plasmonic nanostructure was investigated using a silver-coated atomic force microscopy tip (AgTip) as the plasmonic nanostructure. Using the AgTip, which exhibited a well-defined localized surface plasmon (LSP) resonance band, we controlled the spectral overlap and the distance between the single NQD and the AgTip. The emission behavior of the single NQD when approaching the AgTip at the nanometer scale was measured using off-resonance (405 nm) and resonance (465 nm) excitation of the LSP. We directly observed the conversion of the single-photon emission from a single NQD to multiphoton emission with reduction of the emission lifetime at both excitation wavelengths as the NQD-AgTip distance decreased, whereas a decrease and increase in the emission intensity were observed at 405 and 465 nm excitation, respectively. By combining theoretical analysis and the numerical simulation of the AgTip, we deduced that the enhancement of the multiphoton emission was caused by the quenching of the single-exciton state due to the energy transfer from the NQD to the AgTip and that the emission intensity was increased by enhancement of the excitation rate due to the electric field of the LSP on the AgTip. These results provide evidence that the photon statistics and the photon flux from the single NQD can be manipulated by the plasmonic nanostructure through control of the spectral overlap and the distance.

  4. Detailed Observation of Multiphoton Emission Enhancement from a Single Colloidal Quantum Dot Using a Silver-Coated AFM Tip.

    PubMed

    Takata, Hiroki; Naiki, Hiroyuki; Wang, Li; Fujiwara, Hideki; Sasaki, Keiji; Tamai, Naoto; Masuo, Sadahiro

    2016-09-14

    The enhancement of multiphoton emission from a single colloidal nanocrystal quantum dot (NQD) interacting with a plasmonic nanostructure was investigated using a silver-coated atomic force microscopy tip (AgTip) as the plasmonic nanostructure. Using the AgTip, which exhibited a well-defined localized surface plasmon (LSP) resonance band, we controlled the spectral overlap and the distance between the single NQD and the AgTip. The emission behavior of the single NQD when approaching the AgTip at the nanometer scale was measured using off-resonance (405 nm) and resonance (465 nm) excitation of the LSP. We directly observed the conversion of the single-photon emission from a single NQD to multiphoton emission with reduction of the emission lifetime at both excitation wavelengths as the NQD-AgTip distance decreased, whereas a decrease and increase in the emission intensity were observed at 405 and 465 nm excitation, respectively. By combining theoretical analysis and the numerical simulation of the AgTip, we deduced that the enhancement of the multiphoton emission was caused by the quenching of the single-exciton state due to the energy transfer from the NQD to the AgTip and that the emission intensity was increased by enhancement of the excitation rate due to the electric field of the LSP on the AgTip. These results provide evidence that the photon statistics and the photon flux from the single NQD can be manipulated by the plasmonic nanostructure through control of the spectral overlap and the distance. PMID:27501388

  5. Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy

    SciTech Connect

    Liu Yu; Guo Qiuquan; Nie Hengyong; Lau, W. M.; Yang Jun

    2009-12-15

    The mechanism of dynamic force modes has been successfully applied to many atomic force microscopy (AFM) applications, such as tapping mode and phase imaging. The high-order flexural vibration modes are recent advancement of AFM dynamic force modes. AFM optical lever detection sensitivity plays a major role in dynamic force modes because it determines the accuracy in mapping surface morphology, distinguishing various tip-surface interactions, and measuring the strength of the tip-surface interactions. In this work, we have analyzed optimization and calibration of the optical lever detection sensitivity for an AFM cantilever-tip ensemble vibrating in high-order flexural modes and simultaneously experiencing a wide range and variety of tip-sample interactions. It is found that the optimal detection sensitivity depends on the vibration mode, the ratio of the force constant of tip-sample interactions to the cantilever stiffness, as well as the incident laser spot size and its location on the cantilever. It is also found that the optimal detection sensitivity is less dependent on the strength of tip-sample interactions for high-order flexural modes relative to the fundamental mode, i.e., tapping mode. When the force constant of tip-sample interactions significantly exceeds the cantilever stiffness, the optimal detection sensitivity occurs only when the laser spot locates at a certain distance from the cantilever-tip end. Thus, in addition to the 'globally optimized detection sensitivity', the 'tip optimized detection sensitivity' is also determined. Finally, we have proposed a calibration method to determine the actual AFM detection sensitivity in high-order flexural vibration modes against the static end-load sensitivity that is obtained traditionally by measuring a force-distance curve on a hard substrate in the contact mode.

  6. Method for Measuring the Distribution of Adhesion Forces on Continuous Nanoscale Protrusions Using Carbon Nanofiber Tip on a Scanning Probe Microscope Cantilever.

    PubMed

    Shimoi, Norihiro; Abe, Daisuke

    2015-07-01

    The adhesion force on surfaces has received attention in numerous scientific and technological fields, including catalysis, thin-film growth, and tribology. Many applications require knowledge of the strength of these forces as a function of position in three dimensions, but until now such information has only been theoretically proposed. Here, we demonstrate an approach based on scanning probe microscopy that can obtain such data and be used to image the three-dimensional surface force field of continuous nanoscale protrusions. We present adhesion force maps with nanometer and nanonewton resolution that allow detailed characterization of the interaction between a surface and a thin carbon nanofiber (CNF) rod synthesized by plasma-enhanced chemical vapor deposition (PECVD) at the end of a tip on a scanning probe microscope cantilever in three dimensions. In these maps, the positions of all continuous nanoscale protrusions are identified and the differences in the adhesive forces among limited areas at inequivalent sites are quantified.

  7. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    PubMed

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-29

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  8. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

    PubMed Central

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-01-01

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson’s ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. PMID:26510769

  9. Steering the Self-Assembly of Octadecylamine Monolayers on Mica by Controlled Mechanical Energy Transfer from the AFM Tip

    SciTech Connect

    Benitez, J.J.; Heredia-Guerrero, J.A.; Salmeron, M.

    2010-06-24

    We have studied the effect of mechanical energy transfer from the tip of an Atomic Force Microscope on the dynamics of self-assembly of monolayer films of octadecylamine on mica. The formation of the self-assembled film proceeds in two successive stages, the first being a fast adsorption from solution that follows a Langmuir isotherm. The second is a slower process of island growth by aggregation of the molecules dispersed on the surface. We found that the dynamics of aggregation can be altered substantially by the addition of mechanical energy into the system through controlled tip-surface interactions. This leads to either the creation of pinholes in existing islands as a consequence of vacancy concentration, and to the assembly of residual molecules into more compact islands.

  10. Selective nano-patterning of graphene using a heated atomic force microscope tip

    SciTech Connect

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-15

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

  11. Tip-based nanomanufacturing and metrology of heterogeneous nanostructures

    NASA Astrophysics Data System (ADS)

    Felts, Jonathan R.

    This dissertation presents controlled fabrication and chemical identification of heterogeneous nanostructures using atomic force microscope (AFM) cantilevers. Fabrication and integration of different chemical structures at the nanometer scale is essential for constructing the next generation of electrical, optical, and biological devices. The polymer nanostructures are fabricated using thermal dip pen nanolithography (tDPN), and are characterized using atomic force microscope infrared spectroscopy (AFM-IR). In tDPN, the heated tip of an atomic force microscope cantilever deposits polymer nanostructures onto a surface, where the cantilever heating controls the deposition rate. The nanometer-scale polymer transport between the tip and surface is investigated by controlling tip temperature and substrate temperature over the range 100 -- 260 °C, and for different tip speeds and heating times. It is found that thermal Marangoni forces and non-equilibrium wetting govern the nanometer-scale polymer flow, and that the polymer viscosity governs the mass flow rate. Polymer nanostructures are then characterized by AFM-IR. Nanostructures of polyethylene, polystyrene, and poly(3-dodecylthiophene-2,5-diyl) are fabricated with heights between 100 -- 1000 nm, and find that AFM-IR can measure quantitative IR absorption spectra for structures as small as 100 nm with lateral spatial resolution below 100 nm. The sensitivity of AFM-IR is improved to measure the chemical composition of nanostructures roughly 10 nm tall by applying wavelet transforms to the cantilever response. The IR identification of the smallest polymer nanostructures is about one order of magnitude improvement over state of the art. This improvement is enabled by our insights into the time-domain and frequency-domain behaviors of the polymer nanostructure and cantilever during AFM-IR. The capabilities of AFM-IR are further demonstrated by measuring ohmic heating in highly Si doped InAs microparticles caused by

  12. Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method

    NASA Astrophysics Data System (ADS)

    Li, Qi; Gao, Sitian; Li, Wei; Lu, Mingzhen; Shi, Yushu

    2013-05-01

    A large range multi-functional metrological atomic force microscope based on optical beam deflection method has been set up at NIM one year ago. Being designed intended to make a traceable measurement of standard samples, the machine uses three axes stacked piezoceramic actuators, each axis with a pair of push-pull piezo operated at opposite phases to make orthogonal scanning with maximized dimensional up to 50×50×2mm3. The stage displacement is measured by homodyne interferometer framework in x,y,z direction, from which beams are aligned to intersect at cantilever tip to avoid Abbe error, an eight times optical path multiplier interferometer mirror is researched to enhance fringe resolution. There is also a new compact AFM head integrated with LD, quadrant PD, cantilever, optical path and microscope, the head uses special track lens group to guarantee laser spot focused and static on the back of the cantilever, no matter whether or not the cantilever have lateral movements; similarly, reflect beam also focused and static in the center of quadrant detector through convergence lens group, assumed no cantilever bending on vertical direction. Attribute to above design, the AFM have a resolution up to 0.5nm. In the paper, further improvement is described to reduce the influence of parasitic interference caused by reflection from sample surface using laser multimode modulation, the results shows metrological AFM have a better performance in measuring step, lateral pitch, line width, nanoroughness and other nanoscale structures.

  13. Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy.

    PubMed

    Somnath, Suhas; Collins, Liam; Matheson, Michael A; Sukumar, Sreenivas R; Kalinin, Sergei V; Jesse, Stephen

    2016-10-14

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip-sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques. PMID:27607339

  14. Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy

    NASA Astrophysics Data System (ADS)

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

    2016-10-01

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip-sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.

  15. Polymorphism of amyloid fibrils formed by a peptide from the yeast prion protein Sup35: AFM and Tip-Enhanced Raman Scattering studies.

    PubMed

    Krasnoslobodtsev, Alexey V; Deckert-Gaudig, Tanja; Zhang, Yuliang; Deckert, Volker; Lyubchenko, Yuri L

    2016-06-01

    Aggregation of prion proteins is the cause of various prion related diseases. The infectious form of prions, amyloid aggregates, exist as multiple strains. The strains are thought to represent structurally different prion protein molecules packed into amyloid aggregates, but the knowledge on the structure of different types of aggregates is limited. Here we report on the use of AFM (Atomic Force Microscopy) and TERS (Tip-Enhanced Raman Scattering) to study morphological heterogeneity and access underlying conformational features of individual amyloid aggregates. Using AFM we identified the morphology of amyloid fibrils formed by the peptide (CGNNQQNY) from the yeast prion protein Sup35 that is critically involved in the aggregation of the full protein. TERS results demonstrate that morphologically different amyloid fibrils are composed of a distinct set of conformations. Fibrils formed at pH 5.6 are composed of a mixture of peptide conformations (β-sheets, random coil and α-helix) while fibrils formed in pH~2 solution primarily have β-sheets. Additionally, peak positions in the amide III region of the TERS spectra suggested that peptides have parallel arrangement of β-sheets for pH~2 fibrils and antiparallel arrangement for fibrils formed at pH 5.6. We also developed a methodology for detailed analysis of the peptide secondary structure by correlating intensity changes of Raman bands in different regions of TERS spectra. Such correlation established that structural composition of peptides is highly localized with large contribution of unordered secondary structures on a fibrillar surface. PMID:27060278

  16. Simultaneous AFM nano-patterning and imaging for photomask repair

    NASA Astrophysics Data System (ADS)

    Keyvani, Aliasghar; Tamer, Mehmet S.; van Es, Maarten H.; Sadeghian, Hamed

    2016-03-01

    In this paper we present a new AFM based nano-patterning technique that can be used for fast defect repairing of high resolution photomasks and possibly other high-speed nano-patterning applications. The proposed method works based on hammering the sample with tapping mode AFM followed by wet cleaning of the residuals. On the area where a specific pattern should be written, the tip-sample interaction force is tuned in a controlled manner by changing the excitation frequency of the cantilever without interrupting the imaging process. Using this method several patterns where transferred to different samples with imaging speed. While the pattern was transferred to the sample in each tracing scan line, the patterned sample was imaged in retracing scan line, thus the outcome was immediately visible during the experiment.

  17. Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents

    NASA Astrophysics Data System (ADS)

    McCausland, Jeffrey; Withanage, Sajeevi; Mallik, Robert; Lyuksyutov, Sergei

    A conductive un-biased AFM tip oscillating above p-type or un-doped Si (100) treated with toluene, butan-2-ol, and propan-2-ol creates nanostructures ranging in height from 1-100 nm. The tip was oscillated in ambient conditions (30-70% Rel. Humidity) at frequencies in the 102 kHz range. It was repeatable with various concentrations of solvent in aqueous solution. It is suggested that mechanical oscillations of the AFM tip polarizes the solvent molecules deposited on the surface resulting in electron transfer from the tip to the surface followed by feature formation. This process effectively creates an electrochemical cell at the microscopic level and the miscibility of the solvents is the key to enabling the process. Species which ionize during the process may be consumed in irreversible reactions whereas the alcohols act as catalysts and are not consumed. The influence of boron defects in the Si substrates is also discussed. It appears that the observed oxidation is different from all other similar reported phenomena including local anodic oxidation, and chemo-mechanical lithographic techniques utilizing AFM.

  18. Characterization of piesoelectric ZnO thin films and the fabrication of piezoelectric micro-cantilevers

    SciTech Connect

    Johnson, Raegan Lynn

    2005-01-01

    In Atomic Force Microscopy (AFM), a microcantilever is raster scanned across the surface of a sample in order to obtain a topographical image of the sample's surface. In a traditional, optical AFM, the sample rests on a bulk piezoelectric tube and a control loop is used to control the tip-sample separation by actuating the piezo-tube. This method has several disadvantages--the most noticeable one being that response time of the piezo-tube is rather long which leads to slow imaging speeds. One possible solution aimed at improving the speed of imaging is to incorporate a thin piezoelectric film on top of the cantilever beam. This design not only improves the speed of imaging because the piezoelectric film replaces the piezo-tube as an actuator, but the film can also act as a sensor. In addition, the piezoelectric film can excite the cantilever beam near its resonance frequency. This project aims to fabricate piezoelectric microcantilevers for use in the AFM. Prior to fabricating the cantilevers and also part of this project, a systematic study was performed to examine the effects of deposition conditions on the quality of piezoelectric ZnO thin films deposited by RF sputtering. These results will be presented. The deposition parameters that produced the highest quality ZnO film were used in the fabrication of the piezoelectric cantilevers. Unfortunately, the fabricated cantilevers warped due to the intrinsic stress of the ZnO film and were therefore not usable in the AFM. The complete fabrication process will be detailed, the results will be discussed and reasons for the warping will be examined.

  19. Dynamic behaviour of dagger-shaped cantilevers for atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Shen, Kangzhi; Hurley, Donna C.; Turner, Joseph A.

    2004-11-01

    Experimental techniques based on the atomic force microscope (AFM) have been developed for characterizing mechanical properties at the nanoscale and applied to a variety of materials and structures. Atomic force acoustic microscopy (AFAM) is one such technique that uses spectral information of the AFM cantilever as it vibrates in contact with a sample. In this paper, the dynamic behaviour of AFM cantilevers that have a dagger shape is investigated using a power-series method. Dagger-shaped cantilevers have plan-view geometry consisting of a rectangular section at the clamped end and a triangular section at the tip. Their geometry precludes modelling using closed-form expressions. The convergence of the series is demonstrated and the convergence radius is shown to be related to the given geometry. The accuracy and efficiency of the method are investigated by comparison with finite element results for several different cases. AFAM experiments are modelled by including a linear spring at the tip that represents the contact stiffness. The technique developed is shown to be very effective for inversion of experimental frequency information into contact stiffness results for AFAM. In addition, the sensitivities of the frequencies to the contact stiffness are discussed in terms of the various geometric parameters of the problem including the slope, the ratio of the rectangular to triangular lengths and the tip location. Calculations of contact stiffness from experimental data using this model are shown to be very good in comparison with other models. It is anticipated that this approach may be useful for other cantilever geometries as well, such that AFAM accuracy may be improved.

  20. Prototype cantilevers for quantitative lateral force microscopy

    SciTech Connect

    Reitsma, Mark G.; Gates, Richard S.; Friedman, Lawrence H.; Cook, Robert F.

    2011-09-15

    Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

  1. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.

    PubMed

    Wang, Andrew; Butte, Manish J

    2014-08-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished. PMID:25161320

  2. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    NASA Astrophysics Data System (ADS)

    Wang, Andrew; Butte, Manish J.

    2014-08-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  3. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    SciTech Connect

    Wang, Andrew; Butte, Manish J.

    2014-08-04

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  4. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip.

    PubMed

    Felts, Jonathan R; Somnath, Suhas; Ewoldt, Randy H; King, William P

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s(-1) or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature. PMID:22551550

  5. Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Felts, Jonathan R.; Somnath, Suhas; Ewoldt, Randy H.; King, William P.

    2012-06-01

    We investigate the nanometer-scale flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever tip during thermal dip-pen nanolithography (tDPN). Polymer nanostructures were written for cantilever tip temperatures and substrate temperatures controlled over the range 100-260 °C and while the tip was either moving with speed 0.5-2.0 µm s-1 or stationary and heated for 0.1-100 s. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. The polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  6. Qplus AFM driven nanostencil.

    PubMed

    Grévin, B; Fakir, M; Hayton, J; Brun, M; Demadrille, R; Faure-Vincent, J

    2011-06-01

    We describe the development of a novel setup, in which large stencils with suspended silicon nitride membranes are combined with atomic force microscopy (AFM) regulation by using tuning forks. This system offers the possibility to perform separate AFM and nanostencil operations, as well as combined modes when using stencil chips with integrated tips. The flexibility and performances are demonstrated through a series of examples, including wide AFM scans in closed loop mode, probe positioning repeatability of a few tens of nanometer, simultaneous evaporation of large (several hundred of micron square) and nanoscopic metals and fullerene patterns in static, multistep, and dynamic modes. This approach paves the way for further developments, as it fully combines the advantages of conventional stenciling with the ones of an AFM driven shadow mask. PMID:21721701

  7. Nanoscale rippling on polymer surfaces induced by AFM manipulation

    PubMed Central

    2015-01-01

    Summary Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored and studied. Due to the possibility of varying and controlling various parameters, this phenomenon has recently gained a great interest for some technological applications. The advent of AFM cantilevers with integrated heaters has promoted further advances in the field. An alternative method to heating up the tip is based on solvent-assisted viscoplastic deformations, where the ripples develop upon the application of a relatively low force to a solvent-rich film. An ensemble of AFM-based procedures can thus produce nanoripples on polymeric surfaces quickly, efficiently, and with an unprecedented order and control. However, even if nanorippling has been observed in various distinct modes and many theoretical models have been since proposed, a full understanding of this phenomenon is still far from being achieved. This review aims at summarizing the current state of the art in the perspective of achieving control over the rippling process on polymers at a nanoscale level. PMID:26733086

  8. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  9. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively.

  10. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

    PubMed Central

    Klocke, Michael

    2016-01-01

    Summary A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  11. High-speed AFM for Studying Dynamic Biomolecular Processes

    NASA Astrophysics Data System (ADS)

    Ando, Toshio

    2008-03-01

    Biological molecules show their vital activities only in aqueous solutions. It had been one of dreams in biological sciences to directly observe biological macromolecules (protein, DNA) at work under a physiological condition because such observation is straightforward to understanding their dynamic behaviors and functional mechanisms. Optical microscopy has no sufficient spatial resolution and electron microscopy is not applicable to in-liquid samples. Atomic force microscopy (AFM) can visualize molecules in liquids at high resolution but its imaging rate was too low to capture dynamic biological processes. This slow imaging rate is because AFM employs mechanical probes (cantilevers) and mechanical scanners to detect the sample height at each pixel. It is quite difficult to quickly move a mechanical device of macroscopic size with sub-nanometer accuracy without producing unwanted vibrations. It is also difficult to maintain the delicate contact between a probe tip and fragile samples. Two key techniques are required to realize high-speed AFM for biological research; fast feedback control to maintain a weak tip-sample interaction force and a technique to suppress mechanical vibrations of the scanner. Various efforts have been carried out in the past decade to materialize high-speed AFM. The current high-speed AFM can capture images on video at 30-60 frames/s for a scan range of 250nm and 100 scan lines, without significantly disturbing week biomolecular interaction. Our recent studies demonstrated that this new microscope can reveal biomolecular processes such as myosin V walking along actin tracks and association/dissociation dynamics of chaperonin GroEL-GroES that occurs in a negatively cooperative manner. The capacity of nanometer-scale visualization of dynamic processes in liquids will innovate on biological research. In addition, it will open a new way to study dynamic chemical/physical processes of various phenomena that occur at the liquid-solid interfaces.

  12. Afm Measrurements of Martian Soil Particles Using Mems Technology - Results from the PHOENIX Mission

    NASA Astrophysics Data System (ADS)

    Gautsch, S.; Parrat, D.; de Rooij, N. F.; Staufer, U.; Morookian, J. M.; Hecht, M. H.; Vijendran, S.; Sykulska, H.; Pike, W. T.

    2011-12-01

    Light scattering experiments conducted on Mars indicated that soil particles have dimensions around 1 μm. Particles in that range play an important role in the gas exchange between sub-surface water ice and the atmosphere. Their shape can help tracing the geological history and may indicate past presence of liquid water. NASA's Phoenix mission therefore decided to analyze soil and dust particles in the sub-micrometer to a few micrometer range using an atomic force microscope (AFM) for the first time on another planet. The co-axially mounted AFM was capable of resolving particles with 10nm lateral resolution. A MEMS approach combined with mechatronic concepts for the scanner was selected for implementing the AFM. For redundancy, the sensor chip featured eight silicon cantilevers each with a 7 to 8 μm high tip. The cantilevers could be cleaved off if contaminated. During NASA's Phoenix Mission, which operated on the red planet from May to October 2008, we could demonstrate successful AFM operations. The instrument has executed 85 experiments of which 26 were needed for calibration. Of the remaining experiments about half (28) returned images where signatures of particles could be discerned.

  13. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  14. Nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Ewoldt, Randy; Felts, Jonathan; Somnath, Suhas; King, William

    2012-11-01

    We experimentally investigate nanometer-scale free surface flow of molten polyethylene from a heated atomic force microscope (AFM) cantilever, a nanofabrication process known as thermal dip-pen nanolithography (tDPN). Fluid is deposited from the AFM tip onto non-porous substrates whether the tip is moving or fixed. We find that polymer flow depends on surface capillary forces and not on shear between tip and substrate. The polymer mass flow rate is sensitive to the temperature-dependent polymer viscosity. Additionally, the flow rate increases when a temperature gradient exists between the tip and substrate. We hypothesize that the polymer flow is governed by thermal Marangoni forces and non-equilibrium wetting dynamics caused by a solidification front within the feature.

  15. Oxide nanocrystal based nanocomposites for fabricating photoplastic AFM probes

    NASA Astrophysics Data System (ADS)

    Ingrosso, Chiara; Martin-Olmos, Cristina; Llobera, Andreu; Innocenti, Claudia; Sangregorio, Claudio; Striccoli, Marinella; Agostiano, Angela; Voigt, Anja; Gruetzner, Gabi; Brugger, Jürgen; Perez-Murano, Francesc; Curri, Maria Lucia

    2011-11-01

    We report on the synthesis, characterization and application of a novel nanocomposite made of a negative tone epoxy based photoresist modified with organic-capped Fe2O3 nanocrystals (NCs). The mechanical properties of the nanocomposite drastically improve upon incorporation of a suitable concentration of NCs in the polymer, without deteriorating its photolithography performance. High aspect ratio 3D microstructures made of the nanocomposite have been fabricated with a uniform surface morphology and with a resolution down to few micrometres. The embedded organic-capped Fe2O3 NCs drastically increase the stiffness and hardness of the epoxy based photoresist matrix, making the final material extremely interesting for manufacturing miniaturized polymer based mechanical devices and systems. In particular, the nanocomposite has been used as structural material for fabricating photoplastic Atomic Force Microscopy (AFM) probes with integrated tips showing outstanding mechanical response and high resolution imaging performance. The fabricated probes consist of straight cantilevers with low stress-gradient and high quality factors, incorporating sharp polymeric tips. They present considerably improved performance compared to pure epoxy based photoresist AFM probes, and to commercial silicon AFM probes.We report on the synthesis, characterization and application of a novel nanocomposite made of a negative tone epoxy based photoresist modified with organic-capped Fe2O3 nanocrystals (NCs). The mechanical properties of the nanocomposite drastically improve upon incorporation of a suitable concentration of NCs in the polymer, without deteriorating its photolithography performance. High aspect ratio 3D microstructures made of the nanocomposite have been fabricated with a uniform surface morphology and with a resolution down to few micrometres. The embedded organic-capped Fe2O3 NCs drastically increase the stiffness and hardness of the epoxy based photoresist matrix, making the

  16. Vertically aligned nanostructure scanning probe microscope tips

    DOEpatents

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  17. Calibration of atomic force microscope cantilevers using piezolevers.

    PubMed

    Aksu, Saltuk B; Turner, Joseph A

    2007-04-01

    The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but it can also provide quantitative information when calibrated cantilevers are used. In this article a new technique is demonstrated to calibrate AFM cantilevers using a reference piezolever. Experiments are performed on 13 different commercially available cantilevers. The stiff cantilevers, whose stiffness is more than 0.4 N/m, are compared to the stiffness values measured using nanoindentation. The experimental data collected by the piezolever method is in good agreement with the nanoindentation data. Calibration with a piezolever is fast, easy, and nondestructive and a commercially available AFM is enough to perform the experiments. In addition, the AFM laser must not be calibrated. Calibration is reported here for cantilevers whose stiffness lies between 0.08 and 6.02 N/m.

  18. Three-dimensional atomic force microscopy: interaction force vector by direct observation of tip trajectory.

    PubMed

    Sigdel, Krishna P; Grayer, Justin S; King, Gavin M

    2013-11-13

    The prospect of a robust three-dimensional atomic force microscope (AFM) holds significant promise in nanoscience. Yet, in conventional AFM, the tip-sample interaction force vector is not directly accessible. We scatter a focused laser directly off an AFM tip apex to rapidly and precisely measure the tapping tip trajectory in three-dimensional space. This data also yields three-dimensional cantilever spring constants, effective masses, and hence, the tip-sample interaction force components via Newton's second law. Significant lateral forces representing 49 and 13% of the normal force (Fz = 152 ± 17 pN) were observed in common tapping mode conditions as a silicon tip intermittently contacted a glass substrate in aqueous solution; as a consequence, the direction of the force vector tilted considerably more than expected. When addressing the surface of a lipid bilayer, the behavior of the force components differed significantly from that observed on glass. This is attributed to the lateral mobility of the lipid membrane coupled with its elastic properties. Direct access to interaction components Fx, Fy, and Fz provides a more complete view of tip dynamics that underlie force microscope operation and can form the foundation of a three-dimensional AFM in a plurality of conditions.

  19. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    PubMed

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

  20. Analysis of time-resolved interaction force mode AFM imaging using active and passive probes.

    PubMed

    Giray Oral, Hasan; Parlak, Zehra; Levent Degertekin, F

    2012-09-01

    We present an in-depth analysis of time-resolved interaction force (TRIF) mode imaging for atomic force microscopy (AFM). A nonlinear model of an active AFM probe, performing simultaneous topography and material property imaging on samples with varying elasticity and adhesion is implemented in Simulink®. The model is capable of simulating various imaging modes, probe structures, sample material properties, tip-sample interaction force models, and actuation and feedback schemes. For passive AFM cantilevers, the model is verified by comparing results from the literature. As an example of an active probe, the force sensing integrated readout and active tip (FIRAT) probe is used. Simulation results indicate that the active and damped nature of FIRAT provides a significant level of control over the force applied to the sample, minimizing sample indentation and topography error. Active tip control (ATC) preserves constant contact time during force control for stable contact while preventing the loss of material property information such as elasticity and adhesive force. Simulation results are verified by TRIF mode imaging of the samples with both soft and stiff regions. PMID:22813887

  1. Serial weighting of micro-objects with resonant microchanneled cantilevers.

    PubMed

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-14

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples. PMID:27608651

  2. Serial weighting of micro-objects with resonant microchanneled cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-01

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples.

  3. Serial weighting of micro-objects with resonant microchanneled cantilevers.

    PubMed

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-14

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples.

  4. ezAFM: A low cost Atomic Force Microscope(AFM)

    NASA Astrophysics Data System (ADS)

    Celik, Umit; Celik, Kubra; Aslan, Husnu; Kehribar, Ihsan; Dede, Munir; Ozgur Ozer, H.; Oral, Ahmet

    2012-02-01

    A low cost AFM, ezAFM is developed for educational purposes as well as research. Optical beam deflection method is used to measure the deflection of cantilever. ezAFM scanner is built using voice coil motors (VCM) with ˜50x50x6 μm scan area. The microscope uses alignment free cantilevers, which minimizes setup times. FPGA based AFM feedback Control electronics is developed. FPGA technology allows us to drive all peripherals in parallel. ezAFM Controller is connected to PC by USB 2.0 interface as well as Wi-Fi. We have achieved <5nm lateral and ˜0.01nm vertical resolution. ezAFM can image single atomic steps in HOPG and mica. An optical microscope with <3 μm resolution is also integrated into the system. ezAFM supports different AFM operation modes such as dynamic mode, contact mode, lateral force microscopy. Advanced modes like magnetic force microscopy and electric force microscopy will be implemented later on. The new ezAFM system provides, short learning times for student labs, quick setup and easy to transport for portable applications with the best price/performance ratio. The cost of the system starts from 15,000, with system performance comparable with the traditional AFM systems.

  5. Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation.

    PubMed

    Weafer, P P; McGarry, J P; van Es, M H; Kilpatrick, J I; Ronan, W; Nolan, D R; Jarvis, S P

    2012-09-01

    Atomic force microscopy (AFM) is widely used in the study of both morphology and mechanical properties of living cells under physiologically relevant conditions. However, quantitative experiments on timescales of minutes to hours are generally limited by thermal drift in the instrument, particularly in the vertical (z) direction. In addition, we demonstrate the necessity to remove all air-liquid interfaces within the system for measurements in liquid environments, which may otherwise result in perturbations in the measured deflection. These effects severely limit the use of AFM as a practical tool for the study of long-term cell behavior, where precise knowledge of the tip-sample distance is a crucial requirement. Here we present a readily implementable, cost effective method of minimizing z-drift and liquid instabilities by utilizing active temperature control combined with a customized fluid cell system. Long-term whole cell mechanical measurements were performed using this stabilized AFM by attaching a large sphere to a cantilever in order to approximate a parallel plate system. An extensive examination of the effects of sphere attachment on AFM data is presented. Profiling of cantilever bending during substrate indentation revealed that the optical lever assumption of free ended cantilevering is inappropriate when sphere constraining occurs, which applies an additional torque to the cantilevers "free" end. Here we present the steps required to accurately determine force-indentation measurements for such a scenario. Combining these readily implementable modifications, we demonstrate the ability to investigate long-term whole cell mechanics by performing strain controlled cyclic deformation of single osteoblasts.

  6. A Multifunctional Frontloading Approach for Repeated Recycling of a Pressure-Controlled AFM Micropipette

    PubMed Central

    Roder, Phillip; Hille, Carsten

    2015-01-01

    Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressure-controlled microscale liquid dispenser. This frontloading procedure seems especially attractive when using target substances featuring high costs or low available amounts. Here, the AFM micropipette could be filled from the tip side with liquid from a previously applied droplet with a volume of only a few μL using a short low-pressure pulse. The liquid-loaded AFM micropipettes could be then applied for experiments in air or liquid environments. AFM micropipette frontloading was evaluated with the well-known organic fluorescent dye rhodamine 6G and the AlexaFluor647-labeled antibody goat anti-rat IgG as an example of a larger biological compound. After micropipette usage, specific cleaning procedures were tested. Furthermore, a storage method is described, at which the AFM micropipettes could be stored for a few hours up to several days without drying out or clogging of the microchannel. In summary, the rapid, versatile and cost-efficient frontloading and cleaning procedure for the repeated usage of a single AFM micropipette is beneficial for various application situations from specific surface modifications through to local manipulation of living cells, and provides a simplified and faster handling for already known experiments with fluid force microscopy. PMID:26636981

  7. A Multifunctional Frontloading Approach for Repeated Recycling of a Pressure-Controlled AFM Micropipette.

    PubMed

    Roder, Phillip; Hille, Carsten

    2015-01-01

    Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressure-controlled microscale liquid dispenser. This frontloading procedure seems especially attractive when using target substances featuring high costs or low available amounts. Here, the AFM micropipette could be filled from the tip side with liquid from a previously applied droplet with a volume of only a few μL using a short low-pressure pulse. The liquid-loaded AFM micropipettes could be then applied for experiments in air or liquid environments. AFM micropipette frontloading was evaluated with the well-known organic fluorescent dye rhodamine 6G and the AlexaFluor647-labeled antibody goat anti-rat IgG as an example of a larger biological compound. After micropipette usage, specific cleaning procedures were tested. Furthermore, a storage method is described, at which the AFM micropipettes could be stored for a few hours up to several days without drying out or clogging of the microchannel. In summary, the rapid, versatile and cost-efficient frontloading and cleaning procedure for the repeated usage of a single AFM micropipette is beneficial for various application situations from specific surface modifications through to local manipulation of living cells, and provides a simplified and faster handling for already known experiments with fluid force microscopy. PMID:26636981

  8. Microrheology using a custom-made AFM

    NASA Astrophysics Data System (ADS)

    Kosgodagan Acharige, Sebastien; Benzaquen, Michael; Steinberger, Audrey

    In the past few years, a new method was developed to measure local properties of liquids (X. Xiong et al., Phys. Rev. E 80, 2009). This method consists of gluing a micron-sized glass fiber at the tip of an AFM cantilever and probing the liquid with it. In ENS Lyon, this method was perfected (C. Devailly et al., EPL, 106 5, 2014) with the help of an interferometer developped in the same laboratory (L. Bellon et al., Opt. Commun. 207 49, 2002 and P. Paolino et al., Rev. Sci. Instrum. 84, 2013), which background noise can reach 10-14 m /√{ Hz } . This method allows us to measure a wide range of viscosities (1 mPa . s to 500 mPa . s) of transparent and opaque fluids using a small sample volume ( 5 mL). In this presentation, I will briefly describe the interferometer developped in ENS Lyon, then explain precisely the microrheology measurements and then compare the experimental results to a model developped by M. Benzaquen. This work is supported financially by the ANR project NANOFLUIDYN (Grant Number ANR-13-BS10-0009).

  9. Compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry Joseph

    2006-08-15

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  10. Liquid contact resonance AFM: analytical models, experiments, and limitations

    NASA Astrophysics Data System (ADS)

    Parlak, Zehra; Tu, Qing; Zauscher, Stefan

    2014-11-01

    Contact resonance AFM (CR-AFM) is a scanning probe microscopy technique that utilizes the contact resonances of the AFM cantilever for concurrent imaging of topography and surface stiffness. The technique has not been used in liquid until recently due to analytical and experimental difficulties, associated with viscous damping of cantilever vibrations and fluid loading effects. To address these difficulties, (i) an analytical approach for contact resonances in liquid is developed, and (ii) direct excitation of the contact resonances is demonstrated by actuating the cantilever directly in a magnetic field. By implementing the analytical approach and the direct actuation through magnetic particles, quantitative stiffness imaging on surfaces with a wide range of stiffness can be achieved in liquid with soft cantilevers and low contact forces.

  11. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid

    SciTech Connect

    Reza Akrami, Seyed Mohammad; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-15

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  12. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid.

    PubMed

    Akrami, Seyed Mohammad Reza; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-01

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  13. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.

    PubMed

    Lin, Shueei Muh

    2007-01-01

    In a common environment of atomic force microscopy (AFM), a damping force occurs between a tip and a sample. The influence of damping on the dynamic response of a cantilever must be significant. Moreover, accurate theory is very helpful for the interpretation of a sample's topography and properties. In this study, the effects of damping and nonlinear interatomic tip-sample forces on the dynamic response of an amplitude-formulation AFM are investigated. The damping force is simulated by using the conventional Kelvin-Voigt damping model. The interatomic tip-sample force is the attractive van der Waals force. For consistance with real measurement of a cantilever, the mathematical equations of the beam theory of an AM-AFM are built and its analytical solution is derived. Moreover, an AFM system is also simplified into a mass-spring-damper model. Its exact solution is simple and intuitive. Several relations among the damping ratio, the response ratio, the frequency shift, the energy dissipation and the Q-factor are revealed. It is found that the resonant frequencies and the phase angles determined by the two models are almost same. Significant differences in the resonant quality factors and the response ratios determined by using the two models are also found. Finally, the influences of the variations of several parameters on the error of measuring a sample's topography are investigated. PMID:16982149

  14. Bi-stability of amplitude modulation AFM in air: deterministic and stochastic outcomes for imaging biomolecular systems.

    PubMed

    Santos, Sergio; Barcons, Victor; Font, Josep; Thomson, Neil H

    2010-06-01

    The dynamics of the oscillating microcantilever for amplitude modulation atomic force microscopy (AM AFM) operating in air is well understood theoretically but the experimental outcomes are still emerging. We use double-stranded DNA on mica as a model biomolecular system for investigating the connection between theory and experiment. A demonstration that the switching between the two cantilever oscillation states is stochastic in nature is achieved, and it can be induced by means of topographical anomalies on the surface. Whether one or the other attractor basin is accessed depends on the tip-sample separation history used to achieve the imaging conditions, and we show that the behaviour is reproducible when the tip is stable and well characterized. Emergence of background noise occurs in certain regions of parameter space regardless of whether two cantilever oscillation states coexist. The low state has been explored in detail and we note that at low to intermediate values of the free amplitude, noise-free imaging is achieved. The outcomes shown here are general and demonstrate that a thorough and systematic experimental approach in conjunction with standard modelling gives insight into the mechanisms behind image contrast formation in AM AFM in air. PMID:20453275

  15. Bi-stability of amplitude modulation AFM in air: deterministic and stochastic outcomes for imaging biomolecular systems.

    PubMed

    Santos, Sergio; Barcons, Victor; Font, Josep; Thomson, Neil H

    2010-06-01

    The dynamics of the oscillating microcantilever for amplitude modulation atomic force microscopy (AM AFM) operating in air is well understood theoretically but the experimental outcomes are still emerging. We use double-stranded DNA on mica as a model biomolecular system for investigating the connection between theory and experiment. A demonstration that the switching between the two cantilever oscillation states is stochastic in nature is achieved, and it can be induced by means of topographical anomalies on the surface. Whether one or the other attractor basin is accessed depends on the tip-sample separation history used to achieve the imaging conditions, and we show that the behaviour is reproducible when the tip is stable and well characterized. Emergence of background noise occurs in certain regions of parameter space regardless of whether two cantilever oscillation states coexist. The low state has been explored in detail and we note that at low to intermediate values of the free amplitude, noise-free imaging is achieved. The outcomes shown here are general and demonstrate that a thorough and systematic experimental approach in conjunction with standard modelling gives insight into the mechanisms behind image contrast formation in AM AFM in air.

  16. Probing correlated current and force effects of nanoparticle charge states by hybrid STM-AFM

    NASA Astrophysics Data System (ADS)

    Suganuma, Y.; Trudeau, P.-E.; Dhirani, A.-A.

    2002-12-01

    By using an atomic force microscope (AFM) cantilever as a substrate for a scanning tunneling microscope (STM), we can simultaneously probe currents I and forces F in a tunnel junction as a function of bias voltage V. Measurements performed using gold-nanoparticle (NP) coated cantilevers under ambient conditions reveal correlated kinks in both I-V and F-V curves. Changes in background charge distributions, which have been problematic in controlling single charges in such systems, can be readily detected by the hybrid STM-AFM. To test whether we can statistically attribute observed kinks to Coulomb staircase phenomena, we have performed measurements using NP’s of different sizes. NP’s 4.8 and 2.5 nm in diameter exhibit kinks spaced on average 0.22 and 0.52 V apart, respectively. These values are in good agreement with a metallic sphere flat surface model for the STM tip NP capacitance and the orthodox model for single-electron tunneling.

  17. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    SciTech Connect

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  18. Understanding interferometry for micro-cantilever displacement detection.

    PubMed

    von Schmidsfeld, Alexander; Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions. PMID:27547601

  19. Understanding interferometry for micro-cantilever displacement detection

    PubMed Central

    Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Summary Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber–cantilever configurations. In the Fabry–Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. PMID:27547601

  20. Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

    SciTech Connect

    Wagner, Ryan; Raman, Arvind; Proksch, Roger

    2013-12-23

    Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

  1. Interaction of the Hydrophobic Tip of an Atomic Force Microscope with Oligopeptides Immobilized Using Short and Long Tethers.

    PubMed

    Ma, C Derek; Acevedo-Vélez, Claribel; Wang, Chenxuan; Gellman, Samuel H; Abbott, Nicholas L

    2016-03-29

    We report an investigation of the adhesive force generated between the hydrophobic tip of an atomic force microscope (AFM) and surfaces presenting oligopeptides immobilized using either short (∼1 nm) or long (∼60 nm) tethers. Specifically, we used either sulfosuccinimidyl-4-(N-maleimidomethyl)cyclohexane-1-carboxylate (SSMCC) or 10 kDa polyethylene glycol (PEG) end-functionalized with maleimide and N-hydroxysuccinimide groups to immobilize helical oligomers of β-amino acids (β-peptides) to mixed monolayers presenting tetraethylene glycol (EG4) and amine-terminated EG4 (EG4N) groups. When SSMCC was used to immobilize the β-peptides, we measured the adhesive interaction between the AFM tip and surface to rupture through a single event with magnitude consistent with the interaction of a single β-peptide with the AFM tip. Surprisingly, this occurred even when, on average, multiple β-peptides were located within the interaction area between the AFM tip and surface. In contrast, when using the long 10 kDa PEG tether, we observed the magnitude of the adhesive interaction as well as the dynamics of the rupture events to unmask the presence of the multiple β-peptides within the interaction area. To provide insight into these observations, we formulated a simple mechanical model of the interaction of the AFM tip with the immobilized β-peptides and used the model to demonstrate that adhesion measurements performed using short tethers (but not long tethers) are dominated by the interaction of single β-peptides because (i) the mechanical properties of the short tether are highly nonlinear, thus causing one β-peptide to dominate the adhesion force at the point of rupture, and (ii) the AFM cantilever is mechanically unstable following the rupture of the adhesive interaction with a single β-peptide. Overall, our study reveals that short tethers offer the basis of an approach that facilitates measurement of adhesive interactions with single molecules presented at

  2. Determination and simulation of nanoscale energy dissipation processes in amplitude modulation AFM.

    PubMed

    Gómez, Carlos J; Garcia, Ricardo

    2010-05-01

    We develop a theoretical framework that explains the use of amplitude modulation AFM to measure and identify energy dissipation processes at the nanoscale. The variation of the dissipated energy on a surface by a vibrating tip as a function of its amplitude has a shape that singles out the dissipative process. The method is illustrated by calculating the dynamic-dissipation curves for surface adhesion energy hysteresis, long-range interfacial interactions and viscoelastic processes. We also show that by diving the dissipated energy by its maximum value, the dynamic-dissipation curves become independent of the experimental parameters. In particular, for long-range dissipative processes we have derived an analytical relationship that shows the independence of the normalized dynamic-dissipation curves with respect the free amplitude, cantilever constant or quality factor.

  3. Imaging using lateral bending modes of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Caron, A.; Rabe, U.; Reinstädtler, M.; Turner, J. A.; Arnold, W.

    2004-12-01

    Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

  4. Topography imaging with a heated atomic force microscope cantilever in tapping mode.

    PubMed

    Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M; King, William P

    2007-04-01

    This article describes tapping mode atomic force microscopy (AFM) using a heated AFM cantilever. The electrical and thermal responses of the cantilever were investigated while the cantilever oscillated in free space or was in intermittent contact with a surface. The cantilever oscillates at its mechanical resonant frequency, 70.36 kHz, which is much faster than its thermal time constant of 300 micros, and so the cantilever operates in thermal steady state. The thermal impedance between the cantilever heater and the sample was measured through the cantilever temperature signal. Topographical imaging was performed on silicon calibration gratings of height 20 and 100 nm. The obtained topography sensitivity is as high as 200 microVnm and the resolution is as good as 0.5 nmHz(1/2), depending on the cantilever power. The cantilever heating power ranges 0-7 mW, which corresponds to a temperature range of 25-700 degrees C. The imaging was performed entirely using the cantilever thermal signal and no laser or other optics was required. As in conventional AFM, the tapping mode operation demonstrated here can suppress imaging artifacts and enable imaging of soft samples.

  5. Topography imaging with a heated atomic force microscope cantilever in tapping mode

    SciTech Connect

    Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P.

    2007-04-15

    This article describes tapping mode atomic force microscopy (AFM) using a heated AFM cantilever. The electrical and thermal responses of the cantilever were investigated while the cantilever oscillated in free space or was in intermittent contact with a surface. The cantilever oscillates at its mechanical resonant frequency, 70.36 kHz, which is much faster than its thermal time constant of 300 {mu}s, and so the cantilever operates in thermal steady state. The thermal impedance between the cantilever heater and the sample was measured through the cantilever temperature signal. Topographical imaging was performed on silicon calibration gratings of height 20 and 100 nm. The obtained topography sensitivity is as high as 200 {mu}V/nm and the resolution is as good as 0.5 nm/Hz{sup 1/2}, depending on the cantilever power. The cantilever heating power ranges 0-7 mW, which corresponds to a temperature range of 25-700 deg. C. The imaging was performed entirely using the cantilever thermal signal and no laser or other optics was required. As in conventional AFM, the tapping mode operation demonstrated here can suppress imaging artifacts and enable imaging of soft samples.

  6. Calibration of optical cantilever deflection readers

    NASA Astrophysics Data System (ADS)

    Hu, Zhiyu; Seeley, Tim; Kossek, Sebastian; Thundat, Thomas

    2004-02-01

    Because of its ultrahigh sensitivity, the optical lever detection method similar to that used in the atomic force microscope (AFM) has been widely employed as a standard technique for measuring microcantilever deflection. Along with the increasing interest in using the microcantilever as a sensing platform, there is also a requirement for a reliable calibration technique. Many researchers have used the concept of optical lever detection to construct microcantilever deflection readout instruments for chemical, physical, and biological detection. However, without an AFM piezo z scanner, it is very difficult to precisely calibrate these instruments. Here, we present a step-by-step method to conveniently calibrate an instrument using commercially available piezoresistive cantilevers. The experimental results closely match the theoretical calculation. Following this procedure, one can easily calibrate any optical cantilever deflection detection system with high reproducibility, precision, and reliability. A detailed discussion of the optical lever readout system design has been addressed in this article.

  7. Technology for fabrication of a micromagnet on a tip of a MFM/MRFM probe

    DOEpatents

    Pelekhov, Denis V.; Hammel, P. Chris; Nunes, Jr., Geoffrey; Midzor, Melissa M.; Roukes, Michael

    2004-01-13

    A method for coating the tip of a mechanical resonator for use in magnetic force microscopy and magnetic resonance force microscopy in which the tip is coated with a ferromagnetic material and the cantilever is not, and the product resulting from the method. A cantilever and incorporated tip are coated with a photoresist, except that surface tension keeps photoresist off the tip. The cantilever and tip are then coated with a magnetic material. Next, acetone is used to lift off the magnetic material from the cantilever but not from the tip.

  8. On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids

    SciTech Connect

    Kiracofe, Daniel; Raman, Arvind

    2010-02-15

    The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated by measuring the vibrations of such microcantilevers in air and water using a scanning laser Doppler vibrometer. It is found that for rectangular tipless microcantilevers, the measured fundamental and higher eigenmodes and their equivalent stiffnesses are nearly identical in air and in water. However, for microcantilevers with a tip mass or for picket shaped cantilevers, there is a marked difference in the second (and higher) eigenmode shapes between air and water that leads to a large decrease in their modal stiffness in water as compared to air as well as a decrease in their optical lever sensitivity. These results are explained in terms of hydrodynamic interactions of microcantilevers with nonuniform mass distribution. The results clearly demonstrate that tip mass and hydrodynamic loading must be taken into account in stiffness calibration and optical lever sensitivity calibration while using higher-order eigenmodes in dynamic AFM.

  9. Calibration of the effective spring constant of ultra-short cantilevers for a high-speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Song, Yun-Peng; Wu, Sen; Xu, Lin-Yan; Zhang, Jun-Ming; Dorantes-Gonzalez, Dante J.; Fu, Xing; Hu, Xiao-Dong

    2015-06-01

    Ultra-short cantilevers are a new type of cantilever designed for the next generation of high-speed atomic force microscope (HS-AFM). Ultra-short cantilevers have smaller dimensions and higher resonant frequency than conventional AFM cantilevers. Moreover, their geometry may also be different from the conventional beam-shape or V-shape. These changes increase the difficulty of determining the spring constant for ultra-short cantilevers, and hence limit the accuracy and precision of force measurement based on a HS-AFM. This paper presents an experimental method to calibrate the effective spring constant of ultra-short cantilevers. By using a home-made AFM head, the cantilever is bent against an electromagnetic compensation balance under servo control. Meanwhile the bending force and the cantilever deflection are synchronously measured by the balance and the optical lever in the AFM head, respectively. Then the effective spring constant is simply determined as the ratio of the force to the corresponding deflection. Four ultra-short trapezoid shape cantilevers were calibrated using this method. A quantitative uncertainty analysis showed that the combined relative standard uncertainty of the calibration result is less than 2%, which is better than the uncertainty of any previously reported techniques.

  10. Cantilever spring constant calibration using laser Doppler vibrometry.

    PubMed

    Ohler, Benjamin

    2007-06-01

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  11. Cantilever spring constant calibration using laser Doppler vibrometry

    SciTech Connect

    Ohler, Benjamin

    2007-06-15

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  12. Multi-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experiment

    SciTech Connect

    Boularas, A. Baudoin, F.; Villeneuve-Faure, C.; Clain, S.; Teyssedre, G.

    2014-08-28

    Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis of stored charge quantities, measurements using an Atomic Force Microscope (AFM) must go with an appropriate simulation of electrostatic forces at play in the method. This is the objective of this work, where simulation results for the electrostatic force between an AFM sensor and the dielectric surface are presented for different bias voltages on the tip. The aim is to analyse force-distance curves modification induced by electrostatic charges. The sensor is composed by a cantilever supporting a pyramidal tip terminated by a spherical apex. The contribution to force from cantilever is neglected here. A model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator—PRO-scheme. First results of the computation of electrostatic force for different tip–sample distances (from 0 to 600 nm) and for different DC voltages applied to the tip (6 to 20 V) are shown and compared with experimental data in order to validate our approach.

  13. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  14. Fabrication of wear-resistant silicon microprobe tips for high-speed surface roughness scanning devices

    NASA Astrophysics Data System (ADS)

    Wasisto, Hutomo Suryo; Yu, Feng; Doering, Lutz; Völlmeke, Stefan; Brand, Uwe; Bakin, Andrey; Waag, Andreas; Peiner, Erwin

    2015-05-01

    Silicon microprobe tips are fabricated and integrated with piezoresistive cantilever sensors for high-speed surface roughness scanning systems. The fabrication steps of the high-aspect-ratio silicon microprobe tips were started with photolithography and wet etching of potassium hydroxide (KOH) resulting in crystal-dependent micropyramids. Subsequently, thin conformal wear-resistant layer coating of aluminum oxide (Al2O3) was demonstrated on the backside of the piezoresistive cantilever free end using atomic layer deposition (ALD) method in a binary reaction sequence with a low thermal process and precursors of trimethyl aluminum and water. The deposited Al2O3 layer had a thickness of 14 nm. The captured atomic force microscopy (AFM) image exhibits a root mean square deviation of 0.65 nm confirming the deposited Al2O3 surface quality. Furthermore, vacuum-evaporated 30-nm/200-nm-thick Au/Cr layers were patterned by lift-off and served as an etch mask for Al2O3 wet etching and in ICP cryogenic dry etching. By using SF6/O2 plasma during inductively coupled plasma (ICP) cryogenic dry etching, micropillar tips were obtained. From the preliminary friction and wear data, the developed silicon cantilever sensor has been successfully used in 100 fast measurements of 5- mm-long standard artifact surface with a speed of 15 mm/s and forces of 60-100 μN. Moreover, the results yielded by the fabricated silicon cantilever sensor are in very good agreement with those of calibrated profilometer. These tactile sensors are targeted for use in high-aspect-ratio microform metrology.

  15. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    NASA Astrophysics Data System (ADS)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  16. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision.

    PubMed

    Baumann, Fabian; Heucke, Stephan F; Pippig, Diana A; Gaub, Hermann E

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  17. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

    SciTech Connect

    Chung, Koo-Hyun; Reitsma, Mark G.

    2010-02-15

    This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

  18. Piezoresistive cantilever based nanoflow and viscosity sensor for microchannels.

    PubMed

    Quist, Arjan; Chand, Ami; Ramachandran, Srinivasan; Cohen, Dan; Lal, Ratnesh

    2006-11-01

    Microfluidic channels are microreactors with a wide range of applications, including molecular separations based upon micro/nanoscale physicochemical properties, targeting and delivery of small amount of fluids and molecules, and patterned/directed growth. Their successful applications would require a detailed understanding of phenomena associated with the microscale flow of liquids through these channels, including velocity, viscosity and miscibility. Here we demonstrate a highly sensitive piezoresistive cantilever to measure flow properties in microfluidic channels. By milling down the legs of the piezoresistive cantilevers, we have achieved significantly higher mechanical sensitivity and a smaller spring constant, as determined by AFM. These cantilevers were used in microchannels to measure the viscosity and flow rate of ethylene glycol mixtures in water over a range of concentrations, as well as of low viscosity biologically relevant buffers with different serum levels. The sensor can be used alone or can be integrated in AFM systems for multidimensional study in micro and nanochannels. PMID:17066169

  19. Low temperature scanning force microscopy using piezoresistive cantilevers

    NASA Astrophysics Data System (ADS)

    Meiser, P.; Koblischka, M. R.; Hartmann, U.

    2015-08-01

    A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

  20. Experimental observation of contact mode cantilever dynamics with nanosecond resolution

    NASA Astrophysics Data System (ADS)

    Payton, O. D.; Picco, L.; Champneys, A. R.; Homer, M. E.; Miles, M. J.; Raman, A.

    2011-04-01

    We report the use of a laser Doppler vibrometer to measure the motion of an atomic force microscope contact mode cantilever during continuous line scans of a mica surface. With a sufficiently high density of measurement points the dynamics of the entire cantilever beam, from the apex to the base, can be reconstructed. We demonstrate nanosecond resolution of both rectangular and triangular cantilevers. This technique permits visualization and quantitative measurements of both the normal and lateral tip sample interactions for the first and higher order eigenmodes. The ability to derive quantitative lateral force measurements is of interest to the field of microtribology/nanotribology while the comprehensive understanding of the cantilever's dynamics also aids new cantilever designs and simulations.

  1. Understanding the plasmonics of nanostructured atomic force microscopy tips

    NASA Astrophysics Data System (ADS)

    Sanders, A.; Bowman, R. W.; Zhang, L.; Turek, V.; Sigle, D. O.; Lombardi, A.; Weller, L.; Baumberg, J. J.

    2016-10-01

    Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy, with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local optical response of sharp and spherical-tipped atomic force microscopy (AFM) tips using a scanning hyperspectral imaging technique to identify the plasmonic behaviour. Localised surface plasmon resonances which radiatively couple with far-field light are found only for spherical AFM tips, with little response for sharp AFM tips, in agreement with numerical simulations of the near-field response. The precise tip geometry is thus crucial for plasmon-enhanced spectroscopies, and the typical sharp cones are not preferred.

  2. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

    PubMed Central

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian

    2016-01-01

    Summary We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  3. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers.

    PubMed

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian; Paris, Oskar

    2016-01-01

    We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  4. Lateral force microscope calibration using a modified atomic force microscope cantilever

    SciTech Connect

    Reitsma, M. G.

    2007-10-15

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.

  5. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    PubMed

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.

  6. Transient eigenmodes analysis of single-impact cantilever dynamics combining Fourier and wavelet transforms.

    PubMed

    Pukhova, Valentina; Banfi, Francesco; Ferrini, Gabriele

    2015-05-01

    The transient eigenmode structure of an interacting cantilever during a single impact on different surfaces evidences the excitation of higher flexural modes and low frequency oscillations. The frequency shift of the fundamental mode after the tip comes into contact with the sample surface allows calculating the tip-sample interaction stiffness and evidences the role of capillary condensation and surface wettability on the cantilever dynamics. Wavelet transforms are used to trace the origin of spectral features in the cantilever spectra and calculate force gradients of the tip-sample interaction.

  7. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    SciTech Connect

    Baumann, Fabian; Pippig, Diana A. Gaub, Hermann E.; Heucke, Stephan F.

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  8. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy.

    PubMed

    Loganathan, Muthukumaran; Bristow, Douglas A

    2014-04-01

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  9. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  10. A Weed Cantilever

    ERIC Educational Resources Information Center

    Keller, Elhannan L.; Padalino, John

    1977-01-01

    Describes the Environmental Action Task activity, which may be used as a recreational game or an environmental perception experience, may be conducted indoors or out-of-doors, using weed stems (or spaghetti) and masking tape to construct a cantilever. Small groups of children work together to make the cantilever with the longest arm. Further…

  11. Intrinsic dissipation in atomic force microscopy cantilevers.

    PubMed

    Zypman, Fredy

    2011-07-01

    In this paper we build a practical modification to the standard Euler-Bernoulli equation for flexural modes of cantilever vibrations most relevant for operation of AFM in high vacuum conditions. This is done by the study of a new internal dissipation term into the Euler-Bernoulli equation. This term remains valid in ultra-high vacuum, and becomes particularly relevant when viscous dissipation with the fluid environment becomes negligible. We derive a compact explicit equation for the quality factor versus pressure for all the flexural modes. This expression is used to compare with corresponding extant high vacuum experiments. We demonstrate that a single internal dissipation parameter and a single viscosity parameter provide enough information to reproduce the first three experimental flexural resonances at all pressures. The new term introduced here has a mesoscopic origin in the relative motion between adjacent layers in the cantilever. PMID:21741914

  12. In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude

    PubMed Central

    de Laat, Marcel Lambertus Cornelis; Pérez Garza, Héctor Hugo; Ghatkesar, Murali Krishna

    2016-01-01

    The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust the stiffness in situ of a commercial AFM cantilever is developed. The adjustment is achieved by changing the effective length of the cantilever by electrostatic pull-in. By applying a voltage between the cantilever and an electrode (with an insulating layer at the point of contact), the cantilever snaps to the electrode, reducing the cantilever’s effective length. An analytical model was developed to find the pull-in voltage of the system. Subsequently, a finite element model was developed to study the pull-in behavior. The working principle of this concept is demonstrated with a proof-of-concept experiment. The electrode was positioned close to the cantilever by using a robotic nanomanipulator. To confirm the change in stiffness, the fundamental resonance frequency of the cantilever was measured for varying electrode positions. The results match with the theoretical expectations. The stiffness was adjusted in situ in the range of 0.2 N/m to 27 N/m, covering two orders of magnitude in one single cantilever. This proof-of-concept is the first step towards a micro fabricated prototype, that integrates the electrode positioning system and cantilever that can be used for actual AFM experiments. PMID:27077863

  13. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  14. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties.

    PubMed

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-01

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  15. Quantitative atomic resolution force imaging on epitaxial graphene with reactive and nonreactive AFM probes.

    PubMed

    Boneschanscher, Mark P; van der Lit, Joost; Sun, Zhixiang; Swart, Ingmar; Liljeroth, Peter; Vanmaekelbergh, Daniël

    2012-11-27

    Atomic force microscopy (AFM) images of graphene and graphite show contrast with atomic periodicity. However, the contrast patterns vary depending on the atomic termination of the AFM tip apex and the tip-sample distance, hampering the identification of the atomic positions. Here, we report quantitative AFM imaging of epitaxial graphene using inert (carbon-monoxide-terminated) and reactive (iridium-terminated) tips. The atomic image contrast is markedly different with these tip terminations. With a reactive tip, we observe an inversion from attractive to repulsive atomic contrast with decreasing tip-sample distance, while a nonreactive tip only yields repulsive atomic contrast. We are able to identify the atoms with both tips at any tip-sample distance. This is a prerequisite for future structural and chemical analysis of adatoms, defects, and the edges of graphene nanostructures, crucial for understanding nanoscale graphene devices.

  16. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.

    PubMed

    Rawlings, Colin; Durkan, Colm

    2012-12-01

    The measurement of cantilever parameters is an essential part of performing a calibrated measurement with an atomic force microscope (AFM). The thermal motion method is a widely used technique for calibrating the spring constant of an AFM cantilever, which can be applied to non-rectangular cantilevers. Given the trend towards high frequency scanning, calibration of non-rectangular cantilevers is of increasing importance. This paper presents two results relevant to cantilever calibration via the thermal motion method. We demonstrate the possibility of using the AFM's phase signal to acquire the thermal motion. This avoids the challenges associated with connecting the raw photodiode signal to a separate spectrum analyser. We also describe how numerical calculations may be used to calculate the parameters needed in a thermal motion calibration of a non-rectangular cantilever. Only accurate knowledge of the relative size of the in-plane dimensions of the cantilever is needed in this computation. We use this pair of results in the calibration of a variety of rectangular and non-rectangular cantilevers. We observe an average difference between the Sader and thermal motion values of cantilever stiffness of 10%. PMID:23137943

  17. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.

    PubMed

    Rawlings, Colin; Durkan, Colm

    2012-12-01

    The measurement of cantilever parameters is an essential part of performing a calibrated measurement with an atomic force microscope (AFM). The thermal motion method is a widely used technique for calibrating the spring constant of an AFM cantilever, which can be applied to non-rectangular cantilevers. Given the trend towards high frequency scanning, calibration of non-rectangular cantilevers is of increasing importance. This paper presents two results relevant to cantilever calibration via the thermal motion method. We demonstrate the possibility of using the AFM's phase signal to acquire the thermal motion. This avoids the challenges associated with connecting the raw photodiode signal to a separate spectrum analyser. We also describe how numerical calculations may be used to calculate the parameters needed in a thermal motion calibration of a non-rectangular cantilever. Only accurate knowledge of the relative size of the in-plane dimensions of the cantilever is needed in this computation. We use this pair of results in the calibration of a variety of rectangular and non-rectangular cantilevers. We observe an average difference between the Sader and thermal motion values of cantilever stiffness of 10%.

  18. Parametric effects in nanobeams and AFM

    SciTech Connect

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-10

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  19. Parametric effects in nanobeams and AFM

    NASA Astrophysics Data System (ADS)

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-01

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  20. Calibration of the lateral spring constant of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-10-01

    Atomic force microscope (AFM) is very useful in nano-scale force measurement. Lateral force is typically used in nanoscratch and surface friction measurement based on AFM. As one of the most important parameters to obtain lateral force, the lateral spring constant of AFM cantilever probe is of great significance and needs to be quantitative calibrated. Lateral torsion and lateral force of the cantilever are two parameters need to be measured in lateral spring constant calibration. In this article, we develop a calibration system and introduce a calibration method using an AFM head and an electromagnetic balance. An aluminium column with a known angel on top is placed on the weighing pan of the balance. The cantilever is precisely positioned in the AFM head, then approaches and bends on the aluminium column. During this procedure, the bending force and the lateral torsion of the cantilever are synchronously measured by the balance and an optical lever system, respectively. Then the lateral spring constant is calculated with a formula. By using this method, three kinds of rectangular cantilever are calibrated. The relative standard deviations of the calibration results are smaller than 2%.

  1. Radiation pressure excitation of Low Temperature Atomic Force & Magnetic Force Microscope (LT-AFM/MFM) for Imaging

    NASA Astrophysics Data System (ADS)

    Karci, Ozgur; Celik, Umit; Oral, Ahmet; NanoMagnetics Instruments Ltd. Team; Middle East Tech Univ Team

    2015-03-01

    We describe a novel method for excitation of Atomic Force Microscope (AFM) cantilevers by means of radiation pressure for imaging in an AFM for the first time. Piezo excitation is the most common method for cantilever excitation, but it may cause spurious resonance peaks. A fiber optic interferometer with 1310 nm laser was used both to measure the deflection of cantilever and apply a force to the cantilever in a LT-AFM/MFM from NanoMagnetics Instruments. The laser power was modulated at the cantilever`s resonance frequency by a digital Phase Lock Loop (PLL). The force exerted by the radiation pressure on a perfectly reflecting surface by a laser beam of power P is F = 2P/c. We typically modulate the laser beam by ~ 800 μW and obtain 10nm oscillation amplitude with Q ~ 8,000 at 2.5x10-4 mbar. The cantilever's stiffness can be accurately calibrated by using the radiation pressure. We have demonstrated performance of the radiation pressure excitation in AFM/MFM by imaging a hard disk sample between 4-300K and Abrikosov vortex lattice in BSCCO single crystal at 4K to for the first time.

  2. Liquid ink deposition from an atomic force microscope tip: deposition monitoring and control of feature size.

    PubMed

    O'Connell, Cathal D; Higgins, Michael J; Marusic, David; Moulton, Simon E; Wallace, Gordon G

    2014-03-18

    The controlled deposition of attoliter volumes of liquid inks may engender novel applications such as targeted drug delivery to single cells and localized delivery of chemical reagents at nanoscale dimensions. Although the deposition of small organic molecules from an atomic force microscope tip, known as dip-pen nanolithography (DPN), has been extensively studied, the deposition of liquid inks is little understood. In this work, we have used a set of model ink-substrate systems to develop an understanding of the deposition of viscous liquids using an unmodified AFM tip. First, the growth of dot size with increasing dwell time is characterized. The dynamics of deposition are found to vary for different ink-substrate systems, and the change in deposition rate over the course of an experiment limits our ability to quantify the ink-transfer dynamics in terms of liquid properties and substrate wettability. We find that the most critical parameter affecting the deposition rate is the volume of ink on the cantilever, an effect resulting in a 10-fold decrease in deposition rate (aL/s) over 2 h of printing time. We suggest that a driving force for deposition arises from the gradient in Laplace pressure set up when the tip touches the substrate. Second, the forces acting upon the AFM cantilever during ink deposition were measured in order to gain insight into the underlying ink-transfer mechanism. The force curve data and simple geometrical arguments were used to elucidate the shape of the ink meniscus at the instant of deposition, a methodology that may be used as an accurate and real-time means of monitoring the volume of deposited dots. Taken together, our results illustrate that liquid deposition involves a very different transfer mechanism than traditionally ascribed to DPN molecular transport. PMID:24548246

  3. Calibration of higher eigenmodes of cantilevers.

    PubMed

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem. PMID:27475563

  4. Calibration of higher eigenmodes of cantilevers

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

  5. Multi-directional energy harvesting by piezoelectric cantilever-pendulum with internal resonance

    SciTech Connect

    Xu, J.; Tang, J.

    2015-11-23

    This letter reports a piezoelectric cantilever-pendulum design for multi-directional energy harvesting. A pendulum is attached to the tip of a piezoelectric cantilever-type energy harvester. This design aims at taking advantage of the nonlinear coupling between the pendulum motion in 3-dimensional space and the beam bending vibration at resonances. Experimental studies indicate that, under properly chosen parameters, 1:2 internal resonance can be induced, which enables the multi-directional energy harvesting with a single cantilever. The advantages of the design with respect to traditional piezoelectric cantilever are examined.

  6. High-Gradient Nanomagnets on Cantilevers for Sensitive Detection of Nuclear Magnetic Resonance

    PubMed Central

    Longenecker, Jonilyn G.; Mamin, H. J.; Senko, Alexander W.; Chen, Lei; Rettner, Charles T.; Rugar, Daniel; Marohn, John A.

    2012-01-01

    Detection of magnetic resonance as a force between a magnetic tip and nuclear spins has previously been shown to enable sub-10 nm resolution 1H imaging. Maximizing the spin force in such a magnetic resonance force microscopy (MRFM) experiment demands a high field gradient. In order to study a wide range of samples, it is equally desirable to locate the magnetic tip on the force sensor. Here we report the development of attonewton-sensitivity cantilevers with high gradient cobalt nanomagnet tips. The damage layer thickness and saturation magnetization of the magnetic material were characterized by X-ray photoelectron spectroscopy and superconducting quantum interference device magnetometry. The coercive field and saturation magnetization of an individual tip were quantified in situ using frequency-shift cantilever magnetometry. Measurements of cantilever dissipation versus magnetic field and tip-sample separation were conducted. MRFM signals from protons in a polystyrene film were studied versus rf irradiation frequency and tip-sample separation, and from this data the tip field and tip-field gradient were evaluated. Magnetic tip performance was assessed by numerically modeling the frequency dependence of the magnetic resonance signal. We observed a tip-field gradient ∂Bztip∕∂z estimated to be between 4.4 and 5.4 MT m−1, which is comparable to the gradient used in recent 4 nm resolution 1H imaging experiments and larger by nearly an order of magnitude than the gradient achieved in prior magnet-on-cantilever MRFM experiments. PMID:23033869

  7. Nonlinear Vibrations of Ferroelectric Bimorph Cantilever

    NASA Astrophysics Data System (ADS)

    Ostrovskii, Igor; Nadtochiy, Andriy

    2008-06-01

    Nonlinear vibrations of a bimorph LiNbO3 microcantilever are investigated. A periodically poled LiNbO3 wafer is used as an initial chip. The cantilever is micro-machined near an interdomain wall between two inversely poled domains. The vibrations are excited by an applied rf-voltage, and motion of a cantilever tip is detected optically. Nonlinearity is revealed by measuring the changes in the dependencies of vibration amplitude versus frequency when amplitude increases, and by reading of sub-harmonic oscillations. A surface of the microcantilever may be modified with a silane, which is sensitive to certain biomolecules. This composite nonlinear micro-vibrator may be used for developing a smart biosensor operating in ambient atmosphere in a real time mode.

  8. Investigation of polymer derived ceramics cantilevers for application of high speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Wu, Chia-Yun

    High speed Atomic Force Microscopy (AFM) has a wide variety of applications ranging from nanomanufacturing to biophysics. In order to have higher scanning speed of certain AFM modes, high resonant frequency cantilevers are needed; therefore, the goal of this research is to investigate using polymer derived ceramics for possible applications in making high resonant frequency AFM cantilevers using complex cross sections. The polymer derived ceramic that will be studied, is silicon carbide. Polymer derived ceramics offer a potentially more economic fabrication approach for MEMS due to their relatively low processing temperatures and ease of complex shape design. Photolithography was used to make the desired cantilever shapes with micron scale size followed by a wet etching process to release the cantilevers from the substrates. The whole manufacturing process we use borrow well-developed techniques from the semiconducting industry, and as such this project also could offer the opportunity to reduce the fabrication cost of AFM cantilevers and MEMS in general. The characteristics of silicon carbide made from the precursor polymer, SMP-10 (Starfire Systems), were studied. In order to produce high qualities of silicon carbide cantilevers, where the major concern is defects, proper process parameters needed to be determined. Films of polymer derived ceramics often have defects due to shrinkage during the conversion process. Thus control of defects was a central issue in this study. A second, related concern was preventing oxidation; the polymer derived ceramics we chose is easily oxidized during processing. Establishing an environment without oxygen in the whole process was a significant challenge in the project. The optimization of the parameters for using photolithography and wet etching process was the final and central goal of the project; well established techniques used in microfabrication were modified for use in making the cantilever in the project. The techniques

  9. Selective enhancement of individual cantilever high resonance modes

    NASA Astrophysics Data System (ADS)

    Penedo, Marcos; Hormeño, Silvia; Prieto, Patricia; Alvaro, Raquel; Anguita, José; Briones, Fernando; Luna, Mónica

    2015-12-01

    Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga+ ion implantation in the specific areas of the magnetic material.

  10. Selective enhancement of individual cantilever high resonance modes.

    PubMed

    Penedo, Marcos; Hormeño, Silvia; Prieto, Patricia; Alvaro, Raquel; Anguita, José; Briones, Fernando; Luna, Mónica

    2015-12-01

    Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga(+) ion implantation in the specific areas of the magnetic material.

  11. Selective enhancement of individual cantilever high resonance modes.

    PubMed

    Penedo, Marcos; Hormeño, Silvia; Prieto, Patricia; Alvaro, Raquel; Anguita, José; Briones, Fernando; Luna, Mónica

    2015-12-01

    Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga(+) ion implantation in the specific areas of the magnetic material. PMID:26559931

  12. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER PORTAL ON WEST BANK SIDE LOOKING NORTHWEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  13. VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    VIEW OF BRIDGE CANTILEVER THROUGH TRUSS CANTILEVER SECTION, LOOKING WEST. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  14. The Tip-Sample Interaction in Atomic Force Microscopy and its Implications for Biological Applications.

    NASA Astrophysics Data System (ADS)

    Baselt, David Randall

    This thesis describes the construction of an atomic force microscope and its application to the study of tip -sample interactions, primarily through the use of friction and hardness (elasticity) imaging. Part one describes the atomic force microscope, which consists of a scanned-cantilever stage (chapter 2); a versatile digital signal processor-based control system with self-optimizing feedback, lock-in amplifier emulation (for hardness imaging), and macro programmability (chapter 3); and image processing software (chapter 4). Part two describes a number of results that have helped to characterize the tip-sample interaction and the contact imaging modes used for its study. Meniscus forces act laterally as well as normally, and that they vary with position (chapter 5). Friction measurements couple with scanner position and feedback, and the meniscus effects friction images (chapter 6). Sliding of the tip over the sample surface introduces slope-dependence into hardness measurements (chapter 7). Dull tips can create prominent topography artifacts even on very flat surfaces (chapter 8). In an investigation of collagen fibrils, AFM has revealed the characteristic 65 nm banding pattern, a second, minor banding pattern, and microfibrils that run along the fibril axis. The distribution of proteoglycans along the fibrils creates a characteristic pattern in friction images. Although imaging in water reduces interaction forces, water can also make biological samples more sensitive to force. However, for robust biological samples imaged in air, tip shape presents a greater obstacle than tip -sample interaction forces to obtaining high-resolution images. Tip contamination increases tip-sample friction and can occasionally improve resolution (chapter 9). For a separate project I have designed a general -purpose nearfield scanning optical microscope (chapter 10).

  15. High resolution capabilities of all-silica cantilevered probes for near-field optical microscopy.

    PubMed

    Descrovi, Emiliano; Aeschimann, Laure; Soboleva, Irina; De Angelis, Francesco; Giorgis, Fabrizio; Di Fabrizio, Enzo

    2009-11-01

    We report on the possibility of performing Near-field Scanning Optical Microscopy in illumination mode by means of microfabricated, metal-coated silica probes based on transparent cantilevers. A low spring constant silica cantilever hosts a silica tip at its end showing an hyperbolic profile and a circular symmetry. After evaporation of 100 nm of aluminium on the tip and the cantilever we processed the tip apex by means of a FIB, thus obtaining either a probe apex with an optical aperture or an apertureless probe having a thin metal layer on the top. An excellent quality of near-field images of samples showing sub-wavelength features is obtained in both case. In particular, the apertureless probe allows highly resolved topographical and optical images to be collected at the same time. This work further demonstrates that the use of completely transparent, metal-coated cantilevers greatly simplify the light injection into the probe and the fabrication process consequently.

  16. Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers.

    PubMed

    Slattery, Ashley D; Blanch, Adam J; Ejov, Vladimir; Quinton, Jamie S; Gibson, Christopher T

    2014-08-22

    As a recent technological development, high-speed atomic force microscopy (AFM) has provided unprecedented insights into dynamic processes on the nanoscale, and is capable of measuring material property variation over short timescales. Miniaturized cantilevers developed specifically for high-speed AFM differ greatly from standard cantilevers both in size and dynamic properties, and calibration of the cantilever spring constant is critical for accurate, quantitative measurement. This work investigates specifically, the calibration of these new-generation cantilevers for the first time. Existing techniques are tested and the challenges encountered are reported and the most effective approaches for calibrating fast-scanning cantilevers with high accuracy are identified, providing a resource for microscopists in this rapidly developing field. Not only do these cantilevers offer faster acquisition of images and force data but due to their high resonant frequencies (up to 2 MHz) they are also excellent mass sensors. Accurate measurement of deposited mass requires accurate calibration of the cantilever spring constant, therefore the results of this work will also be useful for mass-sensing applications.

  17. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations.

  18. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers.

    PubMed

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations. PMID:26684144

  19. Cantilever rib grafting in salvage rhinoplasty.

    PubMed

    Shubailat, Ghaith F

    2003-01-01

    Loss of nasal skeletal support, whether congenital, following trauma or secondary to multiple failed surgeries, calls for reconstruction aiming at restoring rigid dorsal stability, maintaining tip projection, and restoring respiratory function. Where septal and conchal grafts are inadequate to be used as building blocks, our procedure of choice has been the cantilever osseocartilagenous rib graft with microscrew fixation. In the past 10 years, 48 patients were candidates for this salvage procedure. Long-term functional and cosmetic results have been highly satisfactory. PMID:15058550

  20. Method for providing a compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo M.; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry J.

    2008-12-16

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  1. Defect reduction in gallium nitride using cantilever epitaxy.

    SciTech Connect

    Mitchell, Christine Charlotte

    2003-08-01

    Cantilever epitaxy (CE) has been developed to produce GaN on sapphire with low dislocation densities as needed for improved devices. The basic mechanism of seeding growth on sapphire mesas and lateral growth of cantilevers until they coalesce has been modified with an initial growth step at 950 C. This step produces a gable with (11{bar 2}2) facets over the mesas, which turns threading dislocations from vertical to horizontal in order to reduce the local density above mesas. This technique has produced material with densities as low as 2-3x10{sup 7}/cm{sup 2} averaged across extended areas of GaN on sapphire, as determined with AFM, TEM and cathodoluminescence (CL). This density is about two orders of magnitude below that of conventional planar growths; these improvements suggest that locating wide-area devices across both cantilever and mesa regions is possible. However, the first implementation of this technique also produced a new defect: cracks at cantilever coalescences with associated arrays of lateral dislocations. These defects have been labeled 'dark-block defects' because they are non-radiative and appear as dark rectangles in CL images. Material has been grown that does not have dark-block defects. Examination of the evolution of the cantilever films for many growths, both partial and complete, indicates that producing a film without these defects requires careful control of growth conditions and crystal morphology at multiple steps. Their elimination enhances optical emission and uniformity over large (mm) size areas.

  2. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.

    PubMed

    Sader, John E; Lu, Jianing; Mulvaney, Paul

    2014-11-01

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied - in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry - neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  3. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied – in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry – neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  4. 3D force and displacement sensor for SFA and AFM measurements.

    PubMed

    Kristiansen, Kai; McGuiggan, Patricia; Carver, Greg; Meinhart, Carl; Israelachvili, Jacob

    2008-02-19

    A new device has been designed, and a prototype built and tested, that can simultaneously measure the displacements and/or the components of a force in three orthogonal directions. The "3D sensor" consists of four or eight strain gauges attached to the four arms of a single cross-shaped force-measuring cantilever spring. Finite element modeling (FEM) was performed to optimize the design configuration to give desired sensitivity of force, displacement, stiffness, and resonant frequency in each direction (x, y, and z) which were tested on a "mesoscale" device and found to agree with the predicted values to within 4-10%. The device can be fitted into a surface forces apparatus (SFA), and a future smaller "microscale" microfabricated version can be fitted into an atomic force microscope (AFM) for simultaneous measurements of the normal and lateral (friction) forces between a tip (or colloidal bead probe) and a surface, and the topography of the surface. Results of the FEM analysis are presented, and approximate equations derived using linear elasticity theory are given for the sensitivity in each direction. Initial calibrations and measurements of thin film rheology (lubrication forces) using the "mesoscale" prototype show the device to function as expected.

  5. Sensitivity of flexural vibration mode of the rectangular atomic force microscope micro cantilevers in liquid to the surface stiffness variations.

    PubMed

    Farokh Payam, Amir

    2013-12-01

    In this paper, the resonance frequencies and modal sensitivity of flexural vibration modes of a rectangular atomic force microscope (AFM) cantilever immersed in a liquid to surface stiffness variations have been analyzed and a closed-form expression is derived. For this purpose, the Euler-Bernoulli beam theory is used to develop the AFM cantilever model in liquid. Then, an expression for the resonance frequencies of AFM cantilever in liquid is derived and the results of the derived expression are compared with the experimental measurements. Based on this expression, the effect of the surface contact stiffness on flexural mode of a rectangular AFM cantilever in a fluid is investigated and compared with the case that AFM cantilever operates in the air. The results show that in the low surface stiffness, the first mode is the most sensitive mode and the best image contrast is obtained by excitation this mode, but by increasing the sample surface stiffness the higher modes have better image contrast. In addition, comparison between modal sensitivities in air and liquid shows that the resonance frequency shifts in the air are greater than the shifts in the fluid, which means that for the similar surface stiffness the image contrast in air, is better than liquid. PMID:23942312

  6. Nanoscale structural features determined by AFM for single virus particles.

    PubMed

    Chen, Shu-wen W; Odorico, Michael; Meillan, Matthieu; Vellutini, Luc; Teulon, Jean-Marie; Parot, Pierre; Bennetau, Bernard; Pellequer, Jean-Luc

    2013-11-21

    In this work, we propose "single-image analysis", as opposed to multi-image averaging, for extracting valuable information from AFM images of single bio-particles. This approach allows us to study molecular systems imaged by AFM under general circumstances without restrictions on their structural forms. As feature exhibition is a resolution correlation, we have performed AFM imaging on surfaces of tobacco mosaic virus (TMV) to demonstrate variations of structural patterns with probing resolution. Two AFM images were acquired with the same tip at different probing resolutions in terms of pixel width, i.e., 1.95 and 0.49 nm per pixel. For assessment, we have constructed an in silico topograph based on the three-dimensional crystal structure of TMV as a reference. The prominent artifacts observed in the AFM-determined shape of TMV were attributed to tip convolutions. The width of TMV rod was systematically overestimated by ~10 nm at both probing resolutions of AFM. Nevertheless, the effects of tip convolution were less severe in vertical orientation so that the estimated height of TMV by AFM imaging was in close agreement with the in silico X-ray topograph. Using dedicated image processing algorithms, we found that at low resolution (i.e., 1.95 nm per pixel), the extracted surface features of TMV can be interpreted as a partial or full helical repeat (three complete turns with ~7.0 nm in length), while individual protein subunits (~2.5 nm) were perceivable only at high resolution. The present study shows that the scales of revealed structural features in AFM images are subject to both probing resolution and processing algorithms for image analysis. PMID:24056758

  7. Viscoelasticity of gelatin surfaces probed by AFM noise analysis.

    PubMed

    Benmouna, Farida; Johannsmann, Diethelm

    2004-01-01

    The viscoelastic properties of surfaces of swollen gelatin were investigated by analyzing the Brownian motion of an atomic force microscopy (AFM) cantilever in contact with the gel surface. A micron-sized glass sphere attached to the AFM cantilever is used as the dynamic probe. When the sphere approaches the gelatin surface, there is a static repulsive force without a jump into contact. The cantilever's Brownian movement is monitored in parallel, providing access to the dynamic sphere-surface interaction as quantified by the dynamic spring constant, kappa, and the drag coefficient, xi. Gelatin is used as a model substance for a variety of other soft surfaces, where the stiffness of the gel can be varied via the solvent quality, the bloom number, and the pH. The modulus derived from the static force-distance curve is in the kPa range, consistent with the literature. However, the dynamic spring constant as derived from the Brownian motion is much larger than the static differential spring constant dF/dz. On retraction, one observes a rather strong adhesion hysteresis. The strength of the bridge (as given by the dynamic spring constant and the drag coefficient) is very small. PMID:15745019

  8. Measurement of Mechanical Properties of Cantilever Shaped Materials

    PubMed Central

    Finot, Eric; Passian, Ali; Thundat, Thomas

    2008-01-01

    Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to a differential stress can all be simultaneously determined for a cantilever. When measuring the mechanical properties of materials, identifying and discerning the most influential parameters responsible for the observed changes in the cantilever response are important. We will, therefore, discuss the effects of various force fields such as those induced by mass loading, residual stress, internal friction of the material, and other changes in the mechanical properties of the microcantilevers. Methods to measure variations in temperature, pressure, or molecular adsorption of water molecules are also discussed. Often these effects occur simultaneously, increasing the number of parameters that need to be concurrently measured to ensure the reliability of the sensors. We therefore systematically investigate the geometric and environmental effects on cantilever measurements including the chemical nature of the underlying interactions. To address the geometric effects we have considered cantilevers with a rectangular or circular cross section. The chemical nature is addressed by using cantilevers fabricated with metals and/or dielectrics. Selective chemical etching, swelling or changes in Young's modulus of the surface were investigated by means of polymeric and inorganic coatings. Finally to address the effect of the environment in which the cantilever operates, the Knudsen number was determined to characterize the molecule-cantilever collisions. Also bimaterial cantilevers with high thermal sensitivity were used to discern the effect of temperature variations. When appropriate

  9. In situ hydrodynamic lateral force calibration of AFM colloidal probes.

    PubMed

    Ryu, Sangjin; Franck, Christian

    2011-11-01

    Lateral force microscopy (LFM) is an application of atomic force microscopy (AFM) to sense lateral forces applied to the AFM probe tip. Recent advances in tissue engineering and functional biomaterials have shown a need for the surface characterization of their material and biochemical properties under the application of lateral forces. LFM equipped with colloidal probes of well-defined tip geometries has been a natural fit to address these needs but has remained limited to provide primarily qualitative results. For quantitative measurements, LFM requires the successful determination of the lateral force or torque conversion factor of the probe. Usually, force calibration results obtained in air are used for force measurements in liquids, but refractive index differences between air and liquids induce changes in the conversion factor. Furthermore, in the case of biochemically functionalized tips, damage can occur during calibration because tip-surface contact is inevitable in most calibration methods. Therefore, a nondestructive in situ lateral force calibration is desirable for LFM applications in liquids. Here we present an in situ hydrodynamic lateral force calibration method for AFM colloidal probes. In this method, the laterally scanned substrate surface generated a creeping Couette flow, which deformed the probe under torsion. The spherical geometry of the tip enabled the calculation of tip drag forces, and the lateral torque conversion factor was calibrated from the lateral voltage change and estimated torque. Comparisons with lateral force calibrations performed in air show that the hydrodynamic lateral force calibration method enables quantitative lateral force measurements in liquid using colloidal probes.

  10. Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback.

    PubMed

    Dede, M; Urkmen, K; Girişen, O; Atabak, M; Oral, A; Farrer, I; Ritchie, D

    2008-02-01

    Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of approximately 50 nm and 7 mG/Hz(1/2) at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; therefore the insulating substrates have to be coated with a thin layer of gold. This constraint can be eliminated with the AFM feedback using sophisticated Hall probes that are integrated with AFM cantilevers. However it is very difficult to micro fabricate these sensors. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The Hall sensor chip is simply glued at the end of a 32.768 kHz or 100 kHz Quartz crystal, which is used as force sensor. An LT-SHPM system is used to scan the samples. The sensor assembly is dithered at the resonance frequency using a digital Phase Locked Loop circuit and frequency shifts are used for AFM tracking. SHPM electronics is modified to detect AFM topography and the frequency shift, along with the magnetic field image. Magnetic domains and topography of an Iron Garnet thin film crystal, NdFeB demagnetised magnet and hard disk samples are presented at room temperature. The performance is found to be comparable with the SHPM using STM feedback.

  11. [Physiological behavior of Cantilever].

    PubMed

    Feeldman, I; Frugone, R; Vládilo, N T

    1990-11-01

    The prosthetic rehabilitation is common of the integral treatment of patients that integral treatment of patients that have lost one or several dental pieces as a consequence of periodontal diseases. It has been demonstrated that plural fixed prothesis to extention, plovide a distribution pattern and magnitude of favourable forces to the periodontal during the different functions of the stomathologic apparatus, that justify rehabilitation based to it patients periodontically affected. The physiological behaviour of cantilever was basically analized on report on different investigation studies performed on patients periodontically diminis hed treated with plural fixed prothesis of crossed are with two unit or bilateral vear cantilever units, dento supported or fixed in place on implants. It is important to emphasize that favourable results previously analized in base to this type of rehabilitation in its different varieties have been obtained through record done on patients in which considerations of indications, design and occlusion stability have been optimized. PMID:2075270

  12. Absorption Spectroscopy and Imaging from the Visible through Mid-IR with 20 nm Resolution Using AFM probes

    NASA Astrophysics Data System (ADS)

    Centrone, Andrea

    2015-03-01

    Correlated nanoscale composition and optical property maps are important to engineer nanomaterials in applications ranging from photovoltaics to sensing and therapeutics. Wavelengths (λs) from the visible to near-IR probe electronic transitions in materials, providing information regarding band gap and defects while light in mid-IR probes vibrational transitions and provide chemical composition. However, light diffraction limits the lateral resolution of conventional micro-spectroscopic techniques to approximately λ/2, which is insufficient to image nanomaterials. Additionally, the λ-dependent resolution impedes direct comparison of spectral maps from different spectral ranges. Photo Thermal Induced Resonance (PTIR) is a novel technique that circumvents light diffraction by employing an AFM tip as a local detector for measuring light absorption with λ-independent nanoscale resolution. Our PTIR setup combines an AFM microscope with three lasers providing λ-tunability from 500 nm to 16000 nm continuously. The AFM tip transduces locally the sample thermal expansion induced by light absorption into large cantilever oscillations. Local absorption spectra (electronic or vibrational) and maps are obtained recording the amplitude of the tip deflection as a function of λ and position, respectively. The working principles of the PTIR technique will be described first, and nano-patterned polymer samples will be used to evaluate its lateral resolution, sensitivity and linearity. Results show that the PTIR signal intensity is proportional to the local absorbed energy suggesting applicability of this technique for quantitative chemical analysis at nanoscale, at least for thin (less than 1000 nm thick) samples. Additionally, a λ-independent resolution as high as 20 nm is demonstrated across the whole spectral range. In the second part of the talk, PTIR will be applied to image the dark plasmonic resonance of gold Asymmetric Split Ring Resonators (A-SRRs) in the mid

  13. Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips

    SciTech Connect

    Eisenstein, Alon; Goh, M. Cynthia

    2012-03-15

    A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

  14. Fabrication of high-aspect-ratio nanotips integrated with single-crystal silicon cantilevers

    NASA Astrophysics Data System (ADS)

    Chen, Henry J. H.; Hung, C. S.

    2007-09-01

    This work presents a novel fabrication technique for an atomic force microscope (AFM) nanotip. The high-aspect-ratio silicon nanotip on a single-crystal silicon cantilever was manufactured using inductive coupling plasma (ICP) anisotropic etching and XeF2 isotropic silicon etching processes. The cantilever shape was defined and the high-aspect-ratio silicon nanotip structure was fabricated by ICP anisotropic deep silicon etching (~50-80 µm deep). Nanotip sharpening and single-crystal Si cantilever undercutting were achieved simultaneously via two-step XeF2 isotropic silicon etching. The final structures were observed by a scanning electron microscope (SEM) and the diameter of the nanotip was about ~30 nm. This process is simple, easy to use, CMOS post-process-compatible and suitable for the future IC integrated AFM nanotip applications.

  15. Investigation of shear force of a single adhesion cell using a self-sensitive cantilever and fluorescence microscopy

    NASA Astrophysics Data System (ADS)

    Hashimoto, Shigetaka; Adachi, Makoto; Iwata, Futoshi

    2015-08-01

    In this paper, we describe a measurement system based on an atomic force microscope (AFM) for the measurement of the shear force and detachment energy of a single adhesion cell on a substrate. The shear force was quantitatively measured from the deflection of a self-sensitive cantilever that was employed for the simple configuration of the AFM manipulator. The shear force behavior of a single cell detaching from the substrate was observed. By staining cells with a fluorescence dye, the deformation shape of the cell being pushed with the cantilever could be clearly observed. The shear force and detachment energy of the cell increased with the size of the cell. The difference in the shear force of single cells on different substrates with different surface energies was quantitatively evaluated. The loading force applied to a single cell increased with the feed speed of the cantilever. The viability of cells after measurement under different feed speeds of the cantilever was also evaluated.

  16. Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

    NASA Astrophysics Data System (ADS)

    Hoof, Sebastian; Nand Gosvami, Nitya; Hoogenboom, Bart W.

    2012-12-01

    Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here, we show that a high-quality resonance (Q >20) can be achieved in aqueous solution by attaching a microgram-bead at the end of the nanogram-cantilever. The resulting increase in cantilever mass causes the resonance frequency to drop significantly. However, the force sensitivity—as expressed via the minimum detectable force gradient—is hardly affected, because of the enhanced quality factor. Through the enhancement of the quality factor, the attached bead also reduces the relative importance of noise in the deflection detector. It can thus yield an improved signal-to-noise ratio when this detector noise is significant. We describe and analyze these effects for a set-up that includes magnetic actuation of the cantilevers and that can be easily implemented in any AFM system that is compatible with an inverted optical microscope.

  17. Measurement of Cantilever Displacement Using a Compact Disk/Digital Versatile Disk Pickup Head

    NASA Astrophysics Data System (ADS)

    Hwu, En‑Te; Huang, Kuang‑Yuh; Hung, Shao‑Kang; Hwang, Ing‑Shouh

    2006-03-01

    We use the optical pickup head of a commercial compact disk (CD)/digital versatile disk (DVD) read only memory (ROM) drive to detect the vertical displacement of micro fabricated cantilever in atomic force microscopy (AFM). Both the contact and AC modes of AFM are demonstrated. The single atomic steps of graphite can be resolved, indicating that atomic resolution in the vertical displacement detection can be achieved with this new setup. The low cost, compact size, and the light weight of CD/DVD optical pickups may offer new advantages in future AFM designs.

  18. Probing the Si(001) surface with a Si tip: An ab initio study

    NASA Astrophysics Data System (ADS)

    Kantorovich, Lev; Hobbs, Chris

    2006-06-01

    Topographic noncontact atomic force microscopy (NC-AFM) images of the p(2×1) and c(4×2) reconstructions of the Si(001) surface are simulated for the cases of weak and strong tip-surface interactions and various temperatures using ab initio density functional theory. In the simulations the surface is imaged by a sharp silicon tip with a single dangling bond at its apex. At a very close approach to the surface, the tip flips a surface dimer when positioned close to its lower atom. The energy barriers for an individual flipped surface dimer to regain its initial configuration are calculated to be ˜0.1eV , implying that the surface should be able to “heal” itself at all but extremely low temperatures during one oscillation cycle of the cantilever. Thus, at small enough temperatures, T⩽70K , and large frequency shifts, the imaging process is dominated by tip induced dimer flip events resulting in a permanent deformation of the surface and an apparent p(2×1) symmetric phase to be observed. No dissipation is expected as the tip oscillations are conservative at these conditions. At intermediate temperatures, 70K⩽T⩽200K , the flipped dimers are able to return to the ground state during each tip oscillation, resulting in continuous healing of the surface and thus large dissipation is expected. At T⩾200K dimers flip back and forth easily resulting in an apparent symmetric p(2×1) phase and noticeable dissipation. At small frequency shifts the dimers do not flip, still the upper dimer atoms are imaged as bright so that surface reconstruction can easily be determined. The possibility of manipulating the orientation of dimers at low temperatures and large frequency shifts by means of preprogrammed scan directions, is also discussed.

  19. Low frequency driven oscillations of cantilevers in viscous fluids at very low Reynolds number

    NASA Astrophysics Data System (ADS)

    Cranch, G. A.; Lane, J. E.; Miller, G. A.; Lou, J. W.

    2013-05-01

    The motion of submerged cantilevers driven by viscous fluids is experimentally investigated and a previously published theoretical model is verified over a broad range of Reynolds number covering 4×10-3≤Re≤2000 at frequencies up to 1 kHz. Both planar and cylindrical cantilevers are implemented using short length (few centimeters) fiber lasers, which are also used to measure the deflections. The driving forces are analyzed in detail illustrating how the dominant force transitions from a pressure related force to a viscous force depending on the Reynolds number of the fluid flow around the cantilever. Simplified, approximate expressions for the tip displacement of cantilevers oscillating in the highly viscous regime are also presented. These results will enable accurate, a priori, calculation of the motion of driven cantilevers over a range of dimensions, geometries, and fluid properties.

  20. A cantilever based optical fiber acoustic sensor fabricated by femtosecond laser micromachining

    NASA Astrophysics Data System (ADS)

    Liu, Jie; Yuan, Lei; Huang, Jie; Xiao, Hai

    2016-04-01

    In this paper, we present a pure silica micro-cantilever based optical fiber sensor for acoustic wave detection. The cantilever is directly fabricated by fs laser micromachining on an optical fiber tip functioning as an inline Fabry-Perot interferometer (FPI). The applied acoustic wave pressurizes the micro-cantilever beam and the corresponding dynamic signals can be probed by the FPI. The thickness, length, and width of the micro-cantilever beam can be flexibly designed and fabricated so that the sensitivity, frequency response, and the total measurement range can be varied to fit many practical applications. Experimental results will be presented and analyzed. Due to the assembly free fabrication of the fs-laser, multiple micro-cantilever beams could be potentially fabricated in/on a single optical fiber for quasi-distributed acoustic mapping with high spatial resolution.

  1. Effect of finite width on deflection and energy release rate of an orthotropic double cantilever specimen

    NASA Technical Reports Server (NTRS)

    Schapery, R. A.; Davidson, B. D.

    1988-01-01

    The problem of an orthotropic cantilevered plate subjected to a uniformly distributed end load is solved by the Rayleigh-Ritz energy method. The result is applied to laminated composite, double cantilevered specimens to estimate the effect of crack tip constraint on the transverse curvature, deflection and energy release rate. The solution is also utilized to determined finite width correction factors for fracture energy characterization tests in which neither plane stress nor plane strain conditions apply.

  2. Bimodal frequency-modulated atomic force microscopy with small cantilevers.

    PubMed

    Dietz, Christian; Schulze, Marcus; Voss, Agnieszka; Riesch, Christian; Stark, Robert W

    2015-02-01

    Small cantilevers with ultra-high resonant frequencies (1-3 MHz) have paved the way for high-speed atomic force microscopy. However, their potential for multi-frequency atomic force microscopy is unexplored. Because small cantilevers have small spring constants but large resonant frequencies, they are well-suited for the characterisation of delicate specimens with high imaging rates. We demonstrate their imaging capabilities in a bimodal frequency modulation mode in constant excitation on semi-crystalline polypropylene. The first two flexural modes of the cantilever were simultaneously excited. The detected frequency shift of the first eigenmode was held constant for topographical feedback, whereas the second eigenmode frequency shift was used to map the local properties of the specimen. High-resolution images were acquired depicting crystalline lamellae of approximately 12 nm in width. Additionally, dynamic force curves revealed that the contrast originated from different interaction forces between the tip and the distinct polymer regions. The technique uses gentle forces during scanning and quantified the elastic moduli Eam = 300 MPa and Ecr = 600 MPa on amorphous and crystalline regions, respectively. Thus, multimode measurements with small cantilevers allow one to map material properties on the nanoscale at high resolutions and increase the force sensitivity compared with standard cantilevers.

  3. An AFM-based surface oxidation process for heavily carbon-doped p-type GaAs with a hole concentration of 1.5×1021 cm-3

    NASA Astrophysics Data System (ADS)

    Shirakashi, J.-I.; Matsumoto, K.; Konagai, M.

    Under appropriate bias conditions in ambient humidity, AFM can be used to selectively oxidize the surface of electronic materials such as metals and semiconductors. Therefore, an AFM-based surface modification technique would be a powerful tool for fabricating nanometer-sized metal (M)/insulator (I) or semiconductor (S)/insulator (I) junction structures. Heavily carbon-doped p-type GaAs with a hole concentration of 1.5×1021 cm-3 is also of great interest for application to novel device structures, because the carrier concentration is comparable to that of normal metals. Selective surface oxidation of carbon-doped p-type GaAs was achieved using a negatively biased conductive tip. The oxidation shown here was carried out under 20-25% ambient humidity. By changing the applied bias voltage and the scanning speed of the cantilever, the size of the modified structure wires was precisely controlled, with a feature size of 10 nm. These results suggest that GaAs-based devices with ultra-small SIS junction systems could be realized using the AFM-based surface oxidation process.

  4. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Sader, John E.; Borgani, Riccardo; Gibson, Christopher T.; Haviland, David B.; Higgins, Michael J.; Kilpatrick, Jason I.; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J.; Slattery, Ashley D.; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-09-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others—standardising AFM force measurements—and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

  5. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers

    NASA Astrophysics Data System (ADS)

    Revilla, Reynier I.

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe-sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10-20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin-ultrathin layers (h < 10-50 nm). Under the same conditions the z-piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD-SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material.

  6. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers.

    PubMed

    Revilla, Reynier I

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe-sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10-20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin-ultrathin layers (h < 10-50 nm). Under the same conditions the z-piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD-SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material.

  7. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers

    NASA Astrophysics Data System (ADS)

    Revilla, Reynier I.

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe–sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10–20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin–ultrathin layers (h < 10–50 nm). Under the same conditions the z–piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD–SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material.

  8. The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers.

    PubMed

    Revilla, Reynier I

    2016-07-01

    The jump-into-contact (JIC) phenomenon in biased atomic force microscopy (AFM) probes on dielectric films is studied. The influence of the film thickness on the position at which the AFM tip collapses irreversibly into the sample surface was theoretically analyzed using a widely accepted analytical expression of the probe-sample electrostatic interaction force. It was demonstrated that for relatively high values of voltage (V > 10-20 V) applied between the probe and the substrate the cantilever deflection at the JIC is independent of the dielectric film thickness for thin-ultrathin layers (h < 10-50 nm). Under the same conditions the z-piezo distance at the JIC follows approximately a linear behavior with the film thickness. Based on this effect an empirical model was formulated to estimate the dielectric permittivity of thin/ultrathin dielectric films using the jump-into-contact distance. The procedure was successfully applied on thin PVD-SiO2 films, obtaining good agreement with a dielectric constant value previously reported for the same material. PMID:27199351

  9. Gland With Cantilever Seal

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B.

    1989-01-01

    Single-piece gland forms tight seal on probe or tube containing liquid or gas at high pressure. Gland and probe align as assembled by simple torquing procedure. Disconnected easily and reused at same site. Made from any of wide variety of materials so compatible with application. Cantilever ring at top of gland bites into wall of tube or probe, sealing it. Wall of tube or probe must be thick enough to accommodate deformation without rupturing. Maximum deformation designed in coordination with seating and deformation of boss or conical seal.

  10. Note: Determination of torsional spring constant of atomic force microscopy cantilevers: combining normal spring constant and classical beam theory.

    PubMed

    Álvarez-Asencio, R; Thormann, E; Rutland, M W

    2013-09-01

    A technique has been developed for the calculation of torsional spring constants for AFM cantilevers based on the combination of the normal spring constant and plate/beam theory. It is easy to apply and allow the determination of torsional constants for stiff cantilevers where the thermal power spectrum is difficult to obtain due to the high resonance frequency and low signal/noise ratio. The applicability is shown to be general and this simple approach can thus be used to obtain torsional constants for any beam shaped cantilever.

  11. PREFACE: NC-AFM 2006: Proceedings of the 9th International Conference on Non-contact Atomic Force Microscopy

    NASA Astrophysics Data System (ADS)

    Tomitori, Masahiko; Onishi, Hiroshi

    2007-02-01

    The advent of scanning probe microscopy (SPM) in the 1980s has significantly promoted nanoscience and nanotechnology. In particular, non-contact atomic force microscopy (NC-AFM), one of the SPM family, has unique capabilities with high spatial resolution for nanoscale measurements in vacuum, air and liquids. In the last decade we have witnessed the rapid progress of NC-AFM with improved performance and increasing applications. A series of NC-AFM international conferences have greatly contributed to this field. Initiated in Osaka in 1998, the NC-AFM meeting has been followed by annual conferences at Pontresina, Hamburg, Kyoto, Montreal, Dingle, Seattle and Bad Essen. The 9th conference was held in Kobe, Japan, 16-20 July 2006. This special issue of Nanotechnology contains the outstanding contributions of the conference. During the meeting delegates learnt about a number of significant advances. Topics covered atomic resolution imaging of metals, semiconductors, insulators, ionic crystals, oxides, molecular systems, imaging of biological materials in various environments and novel instrumentation. Work also included the characterization of electronic and magnetic properties, tip and cantilever fabrication and characterization, atomic distinction based on analysis of tip-sample interaction, atomic scale manipulation, fabrication of nanostructures using NC-AFM, and related theories and simulations. We are greatly impressed by the increasing number of applications, and convinced that NC-AFM and related techniques are building a bridge to a future nano world, where quantum phenomena will dominate and nano devices will be realized. In addition, a special session on SPM road maps was held as a first trial in the field, where the future prospects of SPM were discussed enthusiastically. The overall success of the NC-AFM 2006 conference was due to the efforts of many individuals and groups with respect to scientific and technological progress, as well as the international

  12. Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

    DOE PAGES

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

    2016-09-08

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify themore » findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. In conclusion, GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.« less

  13. AFM investigation of Martian soil simulants on micromachined Si substrates.

    PubMed

    Vijendran, S; Sykulska, H; Pike, W T

    2007-09-01

    The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range have been studied using a combination of optical and atomic force microscopy (AFM) in preparation for the 2007 NASA Phoenix Mars Lander mission. The operation of an atomic force microscope on samples of micrometre-sized soil particles is a poorly investigated area where the unwanted interaction between the scanning tip and loose particles results in poor image quality and tip contamination by the sample. In order to mitigate these effects, etched silicon substrates with a variety of features have been used to facilitate the sorting and gripping of particles. From these experiments, a number of patterns were identified that were particularly good at isolating and immobilizing particles for AFM imaging. This data was used to guide the design of micromachined substrates for the Phoenix AFM. Both individual particles as well as aggregates were successfully imaged, and information on sizes, shapes and surface morphologies were obtained. This study highlights both the strengths and weaknesses of AFM for the potential in situ investigation of Martian soil and dust. Also presented are more general findings of the limiting operational constraints that exist when attempting the AFM of high aspect ratio particles with current technology. The performance of the final designs of the substrates incorporated on Phoenix will be described in a later paper. PMID:17760618

  14. Cantilever clamp fitting

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B. (Inventor)

    1989-01-01

    A device is disclosed for sealing and clamping a cylindrical element which is to be attached to an object such as a wall, a pressurized vessel or another cylindrical element. The device includes a gland having an inner cylindrical wall, which is threaded at one end and is attached at a bendable end to a deformable portion, which in turn is attached to one end of a conical cantilever structure. The other end of the cantilever structure connects at a bendable area to one end of an outer cylindrical wall. The opposite end of cylindrical wall terminates in a thickened portion, the radially outer surface of which is adapted to accommodate a tool for rotating the gland. The terminal end of cylindrical wall also includes an abutment surface, which is adapted to engage a seal, which in turn engages a surface of a receiver. The receiver further includes a threaded portion for engagement with the threaded portion of gland whereby a tightening rotation of gland relative to receiver will cause relative movement between cylindrical walls and of gland. This movement causes a rotation of the conical structure and thus a bending action at bending area and at the bending end of the upper end of inner cylindrical wall. These rotational and bending actions result in a forcing of the deformable portion radially inwardly so as to contact and deform a pipe. This forcible contact creates a seal between gland and pipe, and simultaneously clamps the pipe in position.

  15. Hydrodynamic effects in fast AFM single-molecule force measurements.

    PubMed

    Janovjak, Harald; Struckmeier, Jens; Müller, Daniel J

    2005-02-01

    Atomic force microscopy (AFM) allows the critical forces that unfold single proteins and rupture individual receptor-ligand bonds to be measured. To derive the shape of the energy landscape, the dynamic strength of the system is probed at different force loading rates. This is usually achieved by varying the pulling speed between a few nm/s and a few microm/s, although for a more complete investigation of the kinetic properties higher speeds are desirable. Above 10 microm/s, the hydrodynamic drag force acting on the AFM cantilever reaches the same order of magnitude as the molecular forces. This has limited the maximum pulling speed in AFM single-molecule force spectroscopy experiments. Here, we present an approach for considering these hydrodynamic effects, thereby allowing a correct evaluation of AFM force measurements recorded over an extended range of pulling speeds (and thus loading rates). To support and illustrate our theoretical considerations, we experimentally evaluated the mechanical unfolding of a multi-domain protein recorded at 30 microm/s pulling speed. PMID:15257425

  16. CO tip functionalization in subatomic resolution atomic force microscopy

    SciTech Connect

    Kim, Minjung; Chelikowsky, James R.

    2015-10-19

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule.

  17. The importance of correcting for variable probe-sample interactions in AFM-IR spectroscopy: AFM-IR of dried bacteria on a polyurethane film.

    PubMed

    Barlow, Daniel E; Biffinger, Justin C; Cockrell-Zugell, Allison L; Lo, Michael; Kjoller, Kevin; Cook, Debra; Lee, Woo Kyung; Pehrsson, Pehr E; Crookes-Goodson, Wendy J; Hung, Chia-Suei; Nadeau, Lloyd J; Russell, John N

    2016-08-01

    AFM-IR is a combined atomic force microscopy-infrared spectroscopy method that shows promise for nanoscale chemical characterization of biological-materials interactions. In an effort to apply this method to quantitatively probe mechanisms of microbiologically induced polyurethane degradation, we have investigated monolayer clusters of ∼200 nm thick Pseudomonas protegens Pf-5 bacteria (Pf) on a 300 nm thick polyether-polyurethane (PU) film. Here, the impact of the different biological and polymer mechanical properties on the thermomechanical AFM-IR detection mechanism was first assessed without the additional complication of polymer degradation. AFM-IR spectra of Pf and PU were compared with FTIR and showed good agreement. Local AFM-IR spectra of Pf on PU (Pf-PU) exhibited bands from both constituents, showing that AFM-IR is sensitive to chemical composition both at and below the surface. One distinct difference in local AFM-IR spectra on Pf-PU was an anomalous ∼4× increase in IR peak intensities for the probe in contact with Pf versus PU. This was attributed to differences in probe-sample interactions. In particular, significantly higher cantilever damping was observed for probe contact with PU, with a ∼10× smaller Q factor. AFM-IR chemical mapping at single wavelengths was also affected. We demonstrate ratioing of mapping data for chemical analysis as a simple method to cancel the extreme effects of the variable probe-sample interactions. PMID:27403761

  18. Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer.

    PubMed

    Inada, Natsumi; Asakawa, Hitoshi; Kobayashi, Taiki; Fukuma, Takeshi

    2016-01-01

    Photothermal excitation is a cantilever excitation method that enables stable and accurate operation for dynamic-mode AFM measurements. However, the low excitation efficiency of the method has often limited its application in practical studies. In this study, we propose a method for improving the photothermal excitation efficiency by coating cantilever backside surface near its fixed end with colloidal graphite as a photothermal conversion (PTC) layer. The excitation efficiency for a standard cantilever of PPP-NCHAuD with a spring constant of ≈40 N/m and a relatively stiff cantilever of AC55 with a spring constant of ≈140 N/m were improved by 6.1 times and 2.5 times, respectively, by coating with a PTC layer. We experimentally demonstrate high stability of the PTC layer in liquid by AFM imaging of a mica surface with atomic resolution in phosphate buffer saline solution for more than 2 h without any indication of possible contamination from the coating. The proposed method, using a PTC layer made of colloidal graphite, greatly enhances photothermal excitation efficiency even for a relatively stiff cantilever in liquid. PMID:27335733

  19. Simple, clickable protocol for atomic force microscopy tip modification and its application for trace ricin detection by recognition imaging

    Technology Transfer Automated Retrieval System (TEKTRAN)

    There are three standard steps for AFM tip functionalization in a single molecule recognition force microscope (SMRFM). First, AFM tip is modified to carry a specific chemical function group; second, the cross-linker PEG is attached to the tip; finally, the modified biological molecule is connected ...

  20. Simple, Clickable Protocol for Atomic Force Microscopy Tip Modification and Its Application for Trace Ricin Detection by Recognition Imaging

    Technology Transfer Automated Retrieval System (TEKTRAN)

    There are three standard steps for AFM tip functionalization in a single molecule recognition force microscope (SMRFM). First, AFM tip was modified to carry a specific chemical function group; second, the cross-linker PEG was attached to the tip; finally, the modified biological molecule was connect...

  1. Cantilever epitaxial process

    DOEpatents

    Ashby, Carol I.; Follstaedt, David M.; Mitchell, Christine C.; Han, Jung

    2003-07-29

    A process of growing a material on a substrate, particularly growing a Group II-VI or Group III-V material, by a vapor-phase growth technique where the growth process eliminates the need for utilization of a mask or removal of the substrate from the reactor at any time during the processing. A nucleation layer is first grown upon which a middle layer is grown to provide surfaces for subsequent lateral cantilever growth. The lateral growth rate is controlled by altering the reactor temperature, pressure, reactant concentrations or reactant flow rates. Semiconductor materials, such as GaN, can be produced with dislocation densities less than 10.sup.7 /cm.sup.2.

  2. Chemical sensor with oscillating cantilevered probe

    DOEpatents

    Adams, Jesse D

    2013-02-05

    The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

  3. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever

    NASA Astrophysics Data System (ADS)

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid.

  4. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever.

    PubMed

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid. PMID:23848696

  5. Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever.

    PubMed

    Liu, Fei; de Beer, Sissi; van den Ende, Dirk; Mugele, Frieder

    2013-06-01

    We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzing the thermal bending fluctuations, we minimize possible nonlinearities of the tip-substrate interaction due to finite excitation amplitudes because these fluctuations are smaller than the typical 1 Å, which is much smaller than the characteristic interaction length. Moreover, we avoid the need to determine the phase lag between cantilever excitation and response, which suffers from complications due to hydrodynamic coupling between cantilever and fluid. Consistent results, and especially high-quality dissipation data, are obtained by analyzing the power spectrum and the time autocorrelation of the force fluctuations. We validate our approach by determining the bulk viscosity of OMCTS using tips with a radius of approximately 1 μm at tip-substrate separations >5 nm. For sharp tips we consistently find an exponentially decaying oscillatory tip-substrate interaction stiffness as well as a clearly nonmonotonic variation of the dissipation for tip-substrate distances up to 8 and 6 nm, respectively. Both observations are in line with the results of recent simulations which relate them to distance-dependent transitions of the molecular structure in the liquid.

  6. Batch-fabrication of cantilevered magnets on attonewton-sensitivity mechanical oscillators for scanned-probe nanoscale magnetic resonance imaging.

    PubMed

    Hickman, Steven A; Moore, Eric W; Lee, SangGap; Longenecker, Jonilyn G; Wright, Sarah J; Harrell, Lee E; Marohn, John A

    2010-12-28

    We have batch-fabricated cantilevers with ∼100 nm diameter nickel nanorod tips and force sensitivities of a few attonewtons at 4.2 K. The magnetic nanorods were engineered to overhang the leading edge of the cantilever, and consequently the cantilevers experience what we believe is the lowest surface noise ever achieved in a scanned probe experiment. Cantilever magnetometry indicated that the tips were well magnetized, with a ≤ 20 nm dead layer; the composition of the dead layer was studied by electron microscopy and electron energy loss spectroscopy. In what we believe is the first demonstration of scanned probe detection of electron-spin resonance from a batch-fabricated tip, the cantilevers were used to observe electron-spin resonance from nitroxide spin labels in a film via force-gradient-induced shifts in cantilever resonance frequency. The magnetic field dependence of the magnetic resonance signal suggests a nonuniform tip magnetization at an applied field near 0.6 T.

  7. Solvent-mediated repair and patterning of surfaces by AFM

    SciTech Connect

    Elhadj, S; Chernov, A; De Yoreo, J

    2007-10-30

    A tip-based approach to shaping surfaces of soluble materials with nanometer-scale control is reported. The proposed method can be used, for example, to eliminate defects and inhomogeneities in surface shape, repair mechanical or laser-induced damage to surfaces, or perform 3D lithography on the length scale of an AFM tip. The phenomenon that enables smoothing and repair of surfaces is based on the transport of material from regions of high- to low-curvature within the solution meniscus formed in a solvent-containing atmosphere between the surface in question and an AFM tip scanned over the surface. Using in situ AFM measurements of the kinetics of surface remodeling on KDP (KH{sub 2}PO{sub 4}) crystals in humid air, we show that redistribution of solute material during relaxation of grooves and mounds is driven by a reduction in surface free energy as described by the Gibbs-Thomson law. We find that the perturbation from a flat interface evolves according to the diffusion equation where the effective diffusivity is determined by the product of the surface stiffness and the step kinetic coefficient. We also show that, surprisingly, if the tip is instead scanned over or kept stationary above an atomically flat area of the surface, a convex structure is formed with a diameter that is controlled by the dimensions of the meniscus, indicating that the presence of the tip and meniscus reduces the substrate chemical potential beneath that of the free surface. This allows one to create nanometer-scale 3D structures of arbitrary shape without the removal of substrate material or the use of extrinsic masks or chemical compounds. Potential applications of these tip-based phenomena are discussed.

  8. Assessment of insulated conductive cantilevers for biology and electrochemistry

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Gullo, Maurizio R.; Akiyama, Terunobu; Tonin, Andreas; de Rooij, Nicolaas F.; Staufer, Urs; Engel, Andreas

    2005-08-01

    This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <=0.1 N m-1 and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than 1 pA in faradaic current with a lateral resolution of 7.8 nm.

  9. High throughput reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-01-21

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  10. High throughout reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-11-25

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  11. Force-controlled manipulation of single cells: from AFM to FluidFM.

    PubMed

    Guillaume-Gentil, Orane; Potthoff, Eva; Ossola, Dario; Franz, Clemens M; Zambelli, Tomaso; Vorholt, Julia A

    2014-07-01

    The ability to perturb individual cells and to obtain information at the single-cell level is of central importance for addressing numerous biological questions. Atomic force microscopy (AFM) offers great potential for this prospering field. Traditionally used as an imaging tool, more recent developments have extended the variety of cell-manipulation protocols. Fluidic force microscopy (FluidFM) combines AFM with microfluidics via microchanneled cantilevers with nano-sized apertures. The crucial element of the technology is the connection of the hollow cantilevers to a pressure controller, allowing their operation in liquid as force-controlled nanopipettes under optical control. Proof-of-concept studies demonstrated a broad spectrum of single-cell applications including isolation, deposition, adhesion and injection in a range of biological systems. PMID:24856959

  12. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans.

    PubMed

    Meier, Tobias; Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm(3) is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.

  13. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    PubMed Central

    Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    Summary We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  14. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading

    SciTech Connect

    Kennedy, Scott J.; Cole, Daniel G.; Clark, Robert L.

    2009-12-15

    This work presents a method for force calibration of rectangular atomic force microscopy (AFM) microcantilevers under heavy fluid loading. Theoretical modeling of the thermal response of microcantilevers is discussed including a fluid-structure interaction model of the cantilever-fluid system that incorporates the results of the fluctuation-dissipation theorem. This model is curve fit to the measured thermal response of a cantilever in de-ionized water and a cost function is used to quantify the difference between the theoretical model and measured data. The curve fit is performed in a way that restricts the search space to parameters that reflect heavy fluid loading conditions. The resulting fitting parameters are used to calibrate the cantilever. For comparison, cantilevers are calibrated using Sader's method in air and the thermal noise method in both air and water. For a set of eight cantilevers ranging in stiffness from 0.050 to 5.8 N/m, the maximum difference between Sader's calibration performed in air and the new method performed in water was 9.4%. A set of three cantilevers that violate the aspect ratio assumption associated with the fluid loading model (length-to-width ratios less than 3.5) ranged in stiffness from 0.85 to 4.7 N/m and yielded differences as high as 17.8%.

  15. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading.

    PubMed

    Kennedy, Scott J; Cole, Daniel G; Clark, Robert L

    2009-12-01

    This work presents a method for force calibration of rectangular atomic force microscopy (AFM) microcantilevers under heavy fluid loading. Theoretical modeling of the thermal response of microcantilevers is discussed including a fluid-structure interaction model of the cantilever-fluid system that incorporates the results of the fluctuation-dissipation theorem. This model is curve fit to the measured thermal response of a cantilever in de-ionized water and a cost function is used to quantify the difference between the theoretical model and measured data. The curve fit is performed in a way that restricts the search space to parameters that reflect heavy fluid loading conditions. The resulting fitting parameters are used to calibrate the cantilever. For comparison, cantilevers are calibrated using Sader's method in air and the thermal noise method in both air and water. For a set of eight cantilevers ranging in stiffness from 0.050 to 5.8 N/m, the maximum difference between Sader's calibration performed in air and the new method performed in water was 9.4%. A set of three cantilevers that violate the aspect ratio assumption associated with the fluid loading model (length-to-width ratios less than 3.5) ranged in stiffness from 0.85 to 4.7 N/m and yielded differences as high as 17.8%.

  16. Functionalized AFM probes for force spectroscopy: eigenmode shapes and stiffness calibration through thermal noise measurements.

    PubMed

    Laurent, Justine; Steinberger, Audrey; Bellon, Ludovic

    2013-06-01

    The functionalization of an atomic force microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some questions remain: how does a bead glued at the end of a cantilever influence its mechanical response? And more importantly for quantitative measurements, can we still determine the stiffness of the AFM probe with traditional techniques?In this paper, the influence of the colloidal mass loading on the eigenmode shape and resonant frequency is investigated by measuring the thermal noise on rectangular AFM microcantilevers with and without beads attached at their extremities. The experiments are performed with a home-made ultra-sensitive AFM, based on differential interferometry. The focused beam from the interferometer probes the cantilever at different positions and the spatial shapes of the modes are determined up to the fifth resonance, without external excitation. The results clearly demonstrate that the first eigenmode is almost unchanged by mass loading. However the oscillation behavior of higher resonances presents a marked difference: with a particle glued at its extremity, the nodes of the modes are displaced towards the free end of the cantilever. These results are compared to an analytical model taking into account the mass and inertial moment of the load in an Euler-Bernoulli framework, where the normalization of the eigenmodes is explicitly worked out in order to allow a quantitative prediction of the thermal noise amplitude of each mode. A good agreement between the experimental results and the analytical model is demonstrated, allowing a clean calibration of the probe stiffness.

  17. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers.

    PubMed

    Golovko, Dmytro S; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar

    2007-04-01

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the end of cantilevers, we load them with water microdrops generated by a commercial inkjet dispenser. Such a device is capable of generating drops, and thus masses, of extremely reproducible size. This makes it an ideal tool for calibration tasks. Moreover, the major advantage of water microdrops is that they allow for a nearly contactless calibration: no mechanical micromanipulation of particles on cantilevers is required, neither for their deposition nor for removal. After some seconds the water drop is completely evaporated, and no residues are left on the cantilever surface or tip. We present two variants: we vary the size of the drops and deposit them at the free end of the cantilever, or we keep the size of the drops constant and vary their position along the cantilever. For the second variant, we implemented also numerical simulations. Spring constants measured by this method are comparable to results obtained by the thermal noise method, as we demonstrate for six different cantilevers.

  18. Nondestructive testing and hardness measurement based on contact resonance of piezoelectric cantilevers (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Li, Faxin; Fu, Ji

    2016-04-01

    A suitable defect identification parameter is very important in the field of nondestructive testing (NDT). In this work, we proposed a NDT method which detects the sample's local contact stiffness (LCS) based on the contact resonance of a piezoelectric cantilever. Firstly, through finite element analysis we showed that LCS is quite sensitive to typical defects including debonding, voids, cracks and inclusions, making it a good identification parameter. Secondly, a homemade NDT system containing a piezoelectric unimorph cantilever was assembled to detect the sample's LCS by tracking the contact resonance frequency (CRF) of the cantilever-sample system based on strain signals. Testing results indicated that this NDT system could detect the above mentioned defects efficiently. The cantilever-stiffness dependent detection sensitivity was specially investigated and the stiffer cantilevers were found to be more sensitive to small defects. Then, a piezoelectric bimorph cantilever was fabricated and the electromechanical impedance, other than the strain signals, was measured to track the CRF of the cantilever-system. The LCS is then derived by using the equivalent-circuit model. The electromechanical impedance based NDT system is more compact and can be further developed to be a portable device. Finally, a Vicker indenter is fabricated onto the bimorph tip and the contact area is derived from the measured LCS. Thus the NDT system turns to be a hardness tester without any optical devices. It is very useful for in-situ testing or testing on inner surfaces where conventional hardness tester is not applicable.

  19. A pressure gauge based on gas density measurement from analysis of the thermal noise of an atomic force microscope cantilever

    SciTech Connect

    Seo, Dongjin; Ducker, William A.; Paul, Mark R.

    2012-05-15

    We describe a gas-density gauge based on the analysis of the thermally-driven fluctuations of an atomic force microscope (AFM) cantilever. The fluctuations are modeled as a ring-down of a simple harmonic oscillator, which allows fitting of the resonance frequency and damping of the cantilever, which in turn yields the gas density. The pressure is obtained from the density using the known equation of state. In the range 10-220 kPa, the pressure readings from the cantilever gauge deviate by an average of only about 5% from pressure readings on a commercial gauge. The theoretical description we use to determine the pressure from the cantilever motion is based upon the continuum hypothesis, which sets a minimum pressure for our analysis. It is anticipated that the cantilever gauge could be extended to measure lower pressures given a molecular theoretical description. Alternatively, the gauge could be calibrated for use in the non-continuum range. Our measurement technique is similar to previous AFM cantilever measurements, but the analysis produces improved accuracy.

  20. Modeling and simulating of V-shaped piezoelectric micro-cantilevers using MCS theory considering the various surface geometries

    NASA Astrophysics Data System (ADS)

    Korayem, A. H.; Kianfar, A.; Korayem, M. H.

    2016-10-01

    Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with mechanical and vibration analysis of AFM vibration in the non-contact and tapping modes for V-shaped piezoelectric micro-cantilever (MC) with geometric discontinuities and cross section variation in the air ambient. In the vibration analysis, Euler-Bernoulli beam theory based on modified couple stress (MCS) theory has been used. The governing equation of motion has been derived by using Hamilton's principle. By adopting finite element method (FEM), the MC differential equation has been solved. Damping matrix was considered in the modal space. Frequency response was obtained by using Laplace transform, and it has been compared with experimental results. Newmark algorithm has been used based on constant average acceleration to analyze time response of MC, and then time response results in the vibration mode, far from the sample surface have been compared with experimental data. In vicinity of sample surface, MC is influenced by various nonlinear forces between the probe tip and sample surface, including van der Waals, contact, and capillary forces. Time response was examined at different distances between MC base and sample surface, and the best distance was selected for topography. Topography results of different types of roughness showed that piezoelectric MC has been improved in the air ambient. Topography showed more accurate forms of roughness, when MC passes through sample surface at higher frequencies. The surface topography investigation for tapping and non-contact modes showed that using of these two modes are suitable for topography.

  1. Soft-materials elastic and shear moduli measurement using piezoelectric cantilevers

    NASA Astrophysics Data System (ADS)

    Markidou, Anna; Shih, Wan Y.; Shih, Wei-Heng

    2005-06-01

    We have developed a soft-material elastic modulus and shear modulus sensor using piezoelectric cantilevers. A piezoelectric cantilever is consisted of a highly piezoelectric layer, e.g., lead-zirconate-titanate bonded to a nonpiezoelectric layer, e.g., stainless steel. Applying an electric field in the thickness direction causes a piezoelectric cantilever to bend, generating an axial displacement or force. When a piezoelectric cantilever is in contact with an object, this electric field-generated axial displacement is reduced due to the resistance by the object. With a proper design of the piezoelectric cantilever's geometry, its axial displacements with and without contacting the object could be accurately measured. From these measurements the elastic modulus of the object can be deduced. In this study, we tailored the piezoelectric cantilevers for measuring the elastic and shear moduli of tissue-like soft materials with forces in the submilli Newton to milliNewton range. Elastic moduli and shear moduli of soft materials were measured using piezoelectric cantilevers with a straight tip and an L-shaped tip, respectively. Using gelatin and commercial rubber material as model soft tissues, we showed that a piezoelectric cantilever 1.5-2cm long could measure the elastic modulus and the shear modulus of a small soft material sample (1-3mm wide) in the small strain range (<1%). For samples 5mm high, the resultant compressive (shear) strains were less than 0.5% (1%). The measurements were validated by (1) comparing the measured Young's modulus of the commercial rubber sample with its known value and (2) by measuring both the Young's modulus and shear modulus on the samples and confirming the thus deduced Poisson's ratios with the separately measured Poisson's ratios.

  2. Effect of AFM probe geometry on visco-hyperelastic characterization of soft materials

    NASA Astrophysics Data System (ADS)

    Boccaccio, Antonio; Lamberti, Luciano; Papi, Massimiliano; De Spirito, Marco; Pappalettere, Carmine

    2015-08-01

    Atomic force microscopy (AFM) nanoindentation is very suited for nano- and microscale mechanical characterization of soft materials. Although the structural response of polymeric networks that form soft matter depends on viscous effects caused by the relative slippage of polymeric chains, the usual assumption made in the AFM-based characterization is that the specimen behaves as a purely elastic material and viscous forces are negligible. However, for each geometric configuration of the AFM tip, there will be a limit indentation rate above which viscous effects must be taken into account to correctly determine mechanical properties. A parametric finite element study conducted on 12 geometric configurations of a blunt cone AFM tip (overall, the study included about 200 finite element analyses) allowed us to determine the limit indentation rate for each configuration. The selected tip dimensions cover commercially available products and account for changes in tip geometry caused by serial measurements. Nanoindentation rates cover typical experimental conditions set in AFM bio-measurements on soft matter. Viscous effects appear to be more significant in the case of sharper tips. This implies that, if quantitative data on sample viscosity are not available, using a rounded indenter and carrying out experiments below the limit indentation rate will allow errors in the determination of mechanical properties to be minimized.

  3. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    SciTech Connect

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-15

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm/{radical}(Hz) by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  4. Multidomain piezo-ceramic cantilever

    NASA Astrophysics Data System (ADS)

    Sedorook, David P.

    PZT-5H is a ferroelectric and piezoelectric material that has many applications that are the subjects of current research. As a ferroelectric, PZT-5H has a permanent electrical polarization that arises from ferroelectric domains. In this thesis, numerical simulations were conducted via the well know Finite Element Method of several types of piezoelectric cantilevers that were made of PIC-181, a high quality PZT-5H made in Germany. Single crystal cantilever models with multiple polarization vectors were investigated with Q factors ranging from Q = 50 to Q = 1200, where the acoustical displacements were calculated. Further, the displacements were calculated for a multidomain cantilever model with inversely poled domains and uniform electrode configuration as well as a single crystal cantilever model with uniformly poled crystal and bipolar electrode configuration. It was shown that cantilevers that are less oblong in shape could benefit from the bipolar electrode configuration in applications where size may be an important parameter, for instance in small flying robotic insects. From the experimental measurements of the resonance and anti-resonance frequencies in various PIC-181 samples, the radial and longitudinal components of speed of sound in material were calculated. Experimental results of longitudinal speed of sound differed from the accepted value of 4.6 km/s by 1.6 % error.

  5. Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM

    NASA Astrophysics Data System (ADS)

    Avdic, A.; Lugstein, A.; Wu, M.; Gollas, B.; Pobelov, I.; Wandlowski, T.; Leonhardt, K.; Denuault, G.; Bertagnolli, E.

    2011-04-01

    We demonstrate a reliable microfabrication process for a combined atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) measurement tool. Integrated cone-shaped sensors with boron doped diamond (BDD) or gold (Au) electrodes were fabricated from commercially available AFM probes. The sensor formation process is based on mature semiconductor processing techniques, including focused ion beam (FIB) machining, and highly selective reactive ion etching (RIE). The fabrication approach preserves the geometry of the original AFM tips resulting in well reproducible nanoscaled sensors. The feasibility and functionality of the fully featured tips are demonstrated by cyclic voltammetry, showing good agreement between the measured and calculated currents of the cone-shaped AFM-SECM electrodes.

  6. Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM.

    PubMed

    Avdic, A; Lugstein, A; Wu, M; Gollas, B; Pobelov, I; Wandlowski, T; Leonhardt, K; Denuault, G; Bertagnolli, E

    2011-04-01

    We demonstrate a reliable microfabrication process for a combined atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) measurement tool. Integrated cone-shaped sensors with boron doped diamond (BDD) or gold (Au) electrodes were fabricated from commercially available AFM probes. The sensor formation process is based on mature semiconductor processing techniques, including focused ion beam (FIB) machining, and highly selective reactive ion etching (RIE). The fabrication approach preserves the geometry of the original AFM tips resulting in well reproducible nanoscaled sensors. The feasibility and functionality of the fully featured tips are demonstrated by cyclic voltammetry, showing good agreement between the measured and calculated currents of the cone-shaped AFM-SECM electrodes.

  7. Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM.

    PubMed

    Avdic, A; Lugstein, A; Wu, M; Gollas, B; Pobelov, I; Wandlowski, T; Leonhardt, K; Denuault, G; Bertagnolli, E

    2011-04-01

    We demonstrate a reliable microfabrication process for a combined atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) measurement tool. Integrated cone-shaped sensors with boron doped diamond (BDD) or gold (Au) electrodes were fabricated from commercially available AFM probes. The sensor formation process is based on mature semiconductor processing techniques, including focused ion beam (FIB) machining, and highly selective reactive ion etching (RIE). The fabrication approach preserves the geometry of the original AFM tips resulting in well reproducible nanoscaled sensors. The feasibility and functionality of the fully featured tips are demonstrated by cyclic voltammetry, showing good agreement between the measured and calculated currents of the cone-shaped AFM-SECM electrodes. PMID:21368355

  8. Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard

    SciTech Connect

    Langlois, E. D.; Shaw, G. A.; Kramar, J. A.; Pratt, J. R.; Hurley, D. C.

    2007-09-15

    We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a ''piezosensor'' composed of a piezoresistive cantilever and accompanying electronics. The piezosensor was calibrated before use with an absolute force standard, the NIST electrostatic force balance (EFB). In this way, the piezosensor acts as a force transfer standard traceable to the International System of Units. Seven single-crystal silicon cantilevers with rectangular geometries and nominal spring constants from 0.2 to 40 N/m were measured with the piezosensor method. The values obtained for the spring constant were compared to measurements by four other techniques: the thermal noise method, the Sader method, force loading by a calibrated nanoindentation load cell, and direct calibration by force loading with the EFB. Results from different methods for the same cantilever were generally in agreement, but differed by up to 300% from nominal values. When used properly, the piezosensor approach provides spring-constant values that are accurate to {+-}10% or better. Methods such as this will improve the ability to extract quantitative information from AFM methods.

  9. Technology Tips

    ERIC Educational Resources Information Center

    Mathematics Teacher, 2004

    2004-01-01

    Some inexpensive or free ways that enable to capture and use images in work are mentioned. The first tip demonstrates the methods of using some of the built-in capabilities of the Macintosh and Windows-based PC operating systems, and the second tip describes methods to capture and create images using SnagIt.

  10. High sensitivity resonance frequency measurements of individualmicro-cantilevers using fiber optical interferometry

    SciTech Connect

    Duden, Thomas; Radmilovic, Velimir

    2009-03-04

    We describe a setup for the resonance frequency measurement of individual microcantilevers. The setup displays both high spatial selectivity and sensitivity to specimen vibrations by utilizing a tapered uncoated fiber tip. The high sensitivity to specimen vibrations is achieved by the combination of optical Fabry-Perot interferometry and narrow band RF detection. Wave fronts reflected on the specimen and on the fiber tip end face interfere, thus no reference plane on the specimen is needed, as demonstrated with the example of freestanding silicon nitride micro-cantilevers. The resulting system is integrated in a DB-235 dual beam FIB system, thereby allowing the measurement of micro-cantilever responses during observation in SEM mode. The FIB was used to modify the optical fiber tip. At this point of our RF system development, the microcantilevers used to characterize the detector were not modified in situ.

  11. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-01

    contact angle. All but one of the eight measurements agreed to within 13%. The constant diameter of the nanoneedle also is used to relate viscous damping of the vibrating cantilever to a macroscopic model of Stokes drag on a long cylinder. Expected increases in drag force with insertion depth and viscosity are observed for several glycerol-water solutions. However, an additional damping term (associated with drag of the meniscus on the sidewalls of the nanoneedle) limits the sensitivity of the measurement of drag force for low-viscosity solutions, while low values of Q limit the sensitivity for high-viscosity solutions. Overall, reasonable correspondence is found between the macroscopic models and the measurements with the nanoneedle-tipped probes. Tighter environmental control of the AFM and treatments of needles to give them more ideal surfaces are expected to improve repeatability and make more evident subtle features that currently appear to be present on the F-D and Q damping curves. PMID:18986184

  12. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-01

    contact angle. All but one of the eight measurements agreed to within 13%. The constant diameter of the nanoneedle also is used to relate viscous damping of the vibrating cantilever to a macroscopic model of Stokes drag on a long cylinder. Expected increases in drag force with insertion depth and viscosity are observed for several glycerol-water solutions. However, an additional damping term (associated with drag of the meniscus on the sidewalls of the nanoneedle) limits the sensitivity of the measurement of drag force for low-viscosity solutions, while low values of Q limit the sensitivity for high-viscosity solutions. Overall, reasonable correspondence is found between the macroscopic models and the measurements with the nanoneedle-tipped probes. Tighter environmental control of the AFM and treatments of needles to give them more ideal surfaces are expected to improve repeatability and make more evident subtle features that currently appear to be present on the F-D and Q damping curves.

  13. Sharp Tips on the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

    The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  14. Atomic force microscopy using ZnO whisker tip

    NASA Astrophysics Data System (ADS)

    Kado, H.; Yokoyama, K.; Tohda, T.

    1992-06-01

    We have developed an atomic force microscope (AFM) using a zinc oxide (ZnO) whisker crystal as a probing tip. The ZnO whisker crystal is tetrapodal in shape, with each leg having a length of 5-30 μm, a radius of curvature less than 10 nm, and a cone half angle of 1°-2°. Polyimide thin films rubbed with cloths as liquid-crystal aligning films were employed for AFM imaging. Due to the needle shape of the probing tip, the AFM was able to resolve the tiny grooves (3-5 nm deep, 60-80 nm apart) on these films more clearly than that using a conventional pyramidal tip. The new AFM will be available for precise evaluation of surfaces on which fine structures are microfabricated in nanometer scale.

  15. Dual-Cantilever-Beam Accelerometer

    NASA Technical Reports Server (NTRS)

    Reynolds, Emmitt A.; Speckhart, Frank H.

    1988-01-01

    Sensitivity to velocity changes along beam axis reduced. Weighted-end cantilever beams of accelerometer deflected equally by acceleration in y direction. When acceleration to right as well as up or down, right beam deflected more, while left beam deflected less. Bridge circuit averages outputs of strain gauges measuring deflections, so cross-axis sensitivity of accelerometer reduced. New device simple and inexpensive.

  16. CD-AFM reference metrology at NIST and SEMATECH

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald; Fu, Joseph; Orji, Ndubuisi; Guthrie, William; Allen, Richard; Cresswell, Michael

    2005-05-01

    The National Institute of Standards and Technology (NIST) and SEMATECH have been working together to improve the traceability of critical dimension atomic force microscope (CD-AFM) dimensional metrology in semiconductor manufacturing. A major component of this collaboration has been the implementation of a Reference Measurement System (RMS) at SEMATECH using a current generation CD-AFM. An earlier tool, originally used at SEMATECH, has now been installed at NIST. Uncertainty budgets were developed for pitch, height, and CD measurements using both tools. At present, the standard uncertainties are approximately 0.2 % for pitch measurements and 0.4% for step height measurements. Prior to the current work, CD AFM linewidth measurements were limited to a standard uncertainty of about 5 nm. However, this limit can now be significantly reduced. This reduction results from the completion of the NIST/SEMATECH collaboration on the development of single crystal critical dimension reference materials (SCDDRM). A new generation of these reference materials was released to SEMATECH Member Companies during late 2004. The SEMATECH RMS was used to measure the linewidths of selected features on the distributed specimens. To reduce the uncertainty in tip width calibration, a separate transfer experiment was performed in which samples were measured by CD-AFM and then sent for high resolution transmission electron microscopy (HRTEM). In this manner, CD-AFM could be used to transfer the HRTEM width information to the distributed samples. Consequently, we are now able to reduce the limit on the standard uncertainty (k = 1) of CD-AFM width measurements to 1 nm.

  17. Nanoscale fabrication of a peptide layer using an AFM probe

    NASA Astrophysics Data System (ADS)

    Nakamura, Chikashi; Miyamoto, Chie; Obataya, Ikuo; Nakamura, Noriyuki; Miyake, Jun

    2004-12-01

    Scanning probe microscopy has been applied in many studies to manipulate atoms or molecules. In particular, force spectroscopy using an atomic force microscope (AFM) is a powerful tool to elucidate intermolecular or intramolecular interactions and provide mechanical information. If enzymes could retain their activity when immobilized on probes, not only could enzyme-substrate interactions be investigated but also the probes could be used for precise biomolecular manipulation at the nano-scale. In our study, a method based on "Enzymatic Nanolithography" was successfully performed in a buffered solution using Staphylococcal serine V8 protease and AFM. To estimate the fabricating activity of the protease immobilized on the AFM tip to peptides immobilized on a substrate, we designed and synthesized peptides that showed enzymatic action specific to the protease. When the protease digested the reporter peptide a quencher residue was released from the main flame of the peptide and resulted in fluorescence. In the designed 9 mer peptides, TAMRA functioned as a good quencher for FAM. After contact of the protease-immobilized tip to the reporter peptide layer, a fluorescent area was observed by microscopic imaging.

  18. Near-Field Spectroscopy with Nanoparticles Deposited by AFM

    NASA Technical Reports Server (NTRS)

    Anderson, Mark S.

    2008-01-01

    An alternative approach to apertureless near-field optical spectroscopy involving an atomic-force microscope (AFM) entails less complexity of equipment than does a prior approach. The alternative approach has been demonstrated to be applicable to apertureless near-field optical spectroscopy of the type using an AFM and surface enhanced Raman scattering (SERS), and is expected to be equally applicable in cases in which infrared or fluorescence spectroscopy is used. Apertureless near-field optical spectroscopy is a means of performing spatially resolved analyses of chemical compositions of surface regions of nanostructured materials. In apertureless near-field spectroscopy, it is common practice to utilize nanostructured probe tips or nanoparticles (usually of gold) having shapes and dimensions chosen to exploit plasmon resonances so as to increase spectroscopic-signal strengths. To implement the particular prior approach to which the present approach is an alternative, it is necessary to integrate a Raman spectrometer with an AFM and to utilize a special SERS-active probe tip. The resulting instrumentation system is complex, and the tasks of designing and constructing the system and using the system to acquire spectro-chemical information from nanometer-scale regions on a surface are correspondingly demanding.

  19. Cantilevered probe detector with piezoelectric element

    SciTech Connect

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  20. Cantilevered probe detector with piezoelectric element

    SciTech Connect

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  1. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  2. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2012-07-10

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  3. Tipping Points

    NASA Astrophysics Data System (ADS)

    Hansen, J.

    2007-12-01

    A climate tipping point, at least as I have used the phrase, refers to a situation in which a changing climate forcing has reached a point such that little additional forcing (or global temperature change) is needed to cause large, relatively rapid, climate change. Present examples include potential loss of all Arctic sea ice and instability of the West Antarctic and Greenland ice sheets. Tipping points are characterized by ready feedbacks that amplify the effect of forcings. The notion that these may be runaway feedbacks is a misconception. However, present "unrealized" global warming, due to the climate system's thermal inertia, exacerbates the difficulty of avoiding global warming tipping points. I argue that prompt efforts to slow CO2 emissions and absolutely reduce non-CO2 forcings are both essential if we are to avoid tipping points that would be disastrous for humanity and creation, the planet as civilization knows it.

  4. Tipping Point

    MedlinePlus

    ... Tipping Point by CPSC Blogger September 22 appliance child Childproofing CPSC danger death electrical fall furniture head injury product safety television tipover tv Watch the video in Adobe Flash format. Almost weekly, we see ...

  5. Ultrasensitive magnetometry and magnetic resonance imaging using cantilever detection

    NASA Astrophysics Data System (ADS)

    Rugar, Daniel

    2009-03-01

    Micromachined cantilevers make remarkable magnetometers for nanoscale measurements of magnetic materials and for magnetic resonance imaging (MRI). We present various applications of cantilever magnetometry at low temperature using cantilevers capable of attonewton force sensitivity. Small, unexpected magnetic effects can be seen, such as anomalous damping in magnetic field. A key application is magnetic resonance force microscopy (MRFM) of both electron and nuclear spins. In recent experiments with MRFM-based NMR imaging, 3D spatial resolution better than 10 nm was achieved for protons in individual virus particles. The achieved volumetric resolution represents an improvement of 100 million compared to the best conventional MRI. The microscope is sensitive enough to detect NMR signals from adsorbed layers of hydrocarbon contamination, hydrogen in multiwall carbon nanotubes and the phosphorus in DNA. Operating with a force noise on the order of 6 aN per root hertz with a magnetic tip that produces a field gradient in excess of 30 gauss per nanometer, the magnetic moment sensitivity is ˜0.2 Bohr magnetons. The corresponding field sensitivity is ˜3 nT per root hertz. To our knowledge, this combination of high field sensitivity and nanometer spatial resolution is unsurpassed by any other form of nanometer-scale magnetometry.

  6. Characterization and Optimization of Quartz Tuning Fork-Based Force Sensors for Combined STM/AFM

    NASA Astrophysics Data System (ADS)

    Castellanos-Gomez, Andres; Agraït, Nicolás; Rubio-Bollinger, Gabino

    This chapter will be divided in two main parts. In the first one, we will show a detailed analysis of the dynamics of quartz tuning fork resonators which are being increasingly used in scanning probe microscopy as force sensors. We will also show that a coupled harmonic oscillators model, which includes a finite coupling between the prongs, is in remarkable agreement with the observed motion of the tuning forks. Relevant parameters for the tuning fork performance such as the effective spring constant can be obtained from our analysis. In the second one, we will present an implementation of a quartz tuning fork supplemented with optimized tips based on carbon fibers. The remarkable electrical and mechanical properties of carbon fiber make these tips more suitable for combined and/or simultaneous STM and AFM than conventional metallic tips. The fabrication and the characterization of these carbon fiber tips as well as their performance in STM/AFM will be detailed.

  7. Structural investigations on native collagen type I fibrils using AFM

    SciTech Connect

    Strasser, Stefan; Zink, Albert; Janko, Marek; Heckl, Wolfgang M.; Thalhammer, Stefan . E-mail: stefan.thalhammer@gsf.de

    2007-03-02

    This study was carried out to determine the elastic properties of single collagen type I fibrils with the use of atomic force microscopy (AFM). Native collagen fibrils were formed by self-assembly in vitro characterized with the AFM. To confirm the inner assembly of the collagen fibrils, the AFM was used as a microdissection tool. Native collagen type I fibrils were dissected and the inner core uncovered. To determine the elastic properties of collagen fibrils the tip of the AFM was used as a nanoindentor by recording force-displacement curves. Measurements were done on the outer shell and in the core of the fibril. The structural investigations revealed the banding of the shell also in the core of native collagen fibrils. Nanoindentation experiments showed the same Young's modulus on the shell as well as in the core of the investigated native collagen fibrils. In addition, the measurements indicate a higher adhesion in the core of the collagen fibrils compared to the shell.

  8. Tunnel junctions, cantilevers, and potentials

    NASA Astrophysics Data System (ADS)

    Tanner, Shawn

    We have developed a process for making sub-micrometer dimensional cantilevers, clamped beams, and more complicate electro-mechanical structures that carry integrated electrical leads. Such objects are perhaps useful as test structures for connecting to and measuring the electrical properties of molecular sized objects, as high frequency electromechanical components for radio and microwave frequency applications, and as sensor components for studying the fluctuation physics of small machines. Our process uses two realigned electron-beam lithography steps, a thin film angled deposition system, and differential removal of sacrificial aluminum layers to produce freely suspended sub-micron electromechanical components. We have produced cantilevers and beams on a variety of substrates (silica, silicon, and poly-imide) and have produced insulating, conductive, and multi-layer mechanical structures. We have measured mechanical resonances in the 10 MHz range by electrostatically actuating the cantilevers while in a magnetic field (3500 gauss) and measuring the voltage that results across the front edge of the cantilever. Two structures are fabricated sharing a common ground so that a balanced detection technique can be used to eliminate background signals. Due to the square dependence of the electrostatic force on the voltage, they can be resonated by a drive voltage of 1/2 the natural frequency or at the natural frequency. Two separate attempts have been made to apply these resonators. First, a process was developed to integrate a tunnel junction with the cantilever. These devices can possibly be used for probing small-scale systems such as molecules. We have verified the exponential variation of the tunneling resistance with both substrate flex and electrostatic gating. Second, a novel gate structure was developed to create a double potential well for resonator motion. This is accomplished by placing a multilayer structure in front of the hairpin cantilever consisting two

  9. An experimental-theoretical correlation study of non-linear bending and torsion deformations of a cantilever beam

    NASA Technical Reports Server (NTRS)

    Dowell, E. H.; Traybar, J.; Hodges, D. H.

    1977-01-01

    An experimental study of the large deformation of a cantilevered beam under a gravity tip load has been made. The beam root is rotated so that the tip load is oriented at various angles with respect to the beam principal axes. Static twist and bending deflections of the tip and bending natural frequencies have been measured as a function of tip load magnitude and orientation. The experimental data are compared with the results of a recently developed non-linear structural theory. Agreement is reasonably good when bending deflections are small compared to the beam span, but systematic differences occur for larger deflections.

  10. The stress intensity factor for the double cantilever beam

    NASA Technical Reports Server (NTRS)

    Fichter, W. B.

    1983-01-01

    Fourier transforms and the Wiener-Hopf technique are used in conjunction with plane elastostatics to examine the singular crack tip stress field in the double cantilever beam (DCB) specimen. In place of the Dirac delta function, a family of functions which duplicates the important features of the concentrated forces without introducing unmanageable mathematical complexities is used as a loading function. With terms of order h-squared/a-squared retained in the series expansion, the dimensionless stress intensity factor is found to be K (h to the 1/2)/P = 12 to the 1/2 (a/h + 0.6728 + 0.0377 h-squared/a-squared), in which P is the magnitude of the concentrated forces per unit thickness, a is the distance from the crack tip to the points of load application, and h is the height of each cantilever beam. The result is similar to that obtained by Gross and Srawley by fitting a line to discrete results from their boundary collocation analysis.

  11. Quantitative displacement measurement of a nanotube cantilever with nanometer accuracy using epifluorescence microscopy

    SciTech Connect

    Park, Hyojun; Kwon, Soongeun; Kim, Soohyun

    2009-05-15

    A method to measure the deflection of a nanotube cantilever with nanometer accuracy in an air or liquid environment is presented. We attached fluorescent dyes at the end of a nanotube to detect its deflection. The nanotube cantilever was fabricated with a multiwalled carbon nanotube that is attached to the end of an electrochemically etched tungsten tip, and it was imaged in an epifluorescence microscope system. The fluorescence intensity distribution of the fluorescent particles at the end of the nanotube was approximated with a Gaussian and fitted by least-squares method. Finally, we were able to measure the displacement of the nanotube cantilever during electrostatic actuation with positional accuracy of a few nanometers. This technique can be applied to a manipulator or a force transducer on related a few piconewton forces.

  12. Fabrication of high-density cantilever arrays and through-wafer interconnects

    SciTech Connect

    A. Harley, J.; Abdollahi-Alibeik, S.; Chow, E. M.; Kenney, T. W.; McCarthy, A. M.; McVittie, J. P.; Partridge; Quate, C. F.; Soh, H. T.

    1998-11-03

    Processes to fabricate dense, dry released microstructures with electrical connections on the opposite side of the wafer are described. A 10 x 10 array of silicon and polysilicon cantilevers with high packing density (5 tips/mm2) and high uniformity (<10 µm length variation across the wafer) are demonstrated. The cantilever release process uses a deep SF6/C4F8, plasma etch followed by a HBr plasma etch to accurately release cantilevers. A process for fabricating electrical contacts through the backside of the wafer is also described. Electrodeposited resist, conformal CVD metal deposition and deep SF6/C4F8 plasma etching are used to make 30 µm/side square vias each of which has a resistance of 50 m(omega).

  13. Investigation of static and dynamic behavior of functionally graded piezoelectric actuated Poly-Si micro cantilever probe

    NASA Astrophysics Data System (ADS)

    Pandey, Vibhuti Bhushan; Parashar, Sandeep Kumar

    2016-04-01

    In the present paper a novel functionally graded piezoelectric (FGP) actuated Poly-Si micro cantilever probe is proposed for atomic force microscope. The shear piezoelectric coefficient d15 has much higher value than coupling coefficients d31 and d33, hence in the present work the micro cantilever beam actuated by d15 effect is utilized. The material properties are graded in the thickness direction of actuator by a simple power law. A three dimensional finite element analysis has been performed using COMSOL Multiphysics® (version 4.2) software. Tip deflection and free vibration analysis for the micro cantilever probe has been done. The results presented in the paper shall be useful in the design of micro cantilever probe and their subsequent utilization in atomic force microscopes.

  14. Single-cycle-PLL detection for real-time FM-AFM applications.

    PubMed

    Schlecker, Benedikt; Dukic, Maja; Erickson, Blake; Ortmanns, Maurits; Fantner, Georg; Anders, Jens

    2014-04-01

    In this paper we present a novel architecture for phase-locked loop (PLL) based high-speed demodulation of frequency-modulated (FM) atomic force microscopy (AFM) signals. In our approach, we use single-sideband (SSB) frequency upconversion to translate the AFM signal from the position sensitive detector to a fixed intermediate frequency (IF) of 10 MHz. In this way, we fully benefit from the excellent noise performance of PLL-based FM demodulators still avoiding the intrinsic bandwidth limitation of such systems. In addition, the upconversion to a fixed IF renders the PLL demodulator independent of the cantilever's resonance frequency, allowing the system to work with a large range of cantilever frequencies. To investigate if the additional noise introduced by the SSB upconverter degrades the system noise figure we present a model of the AM-to-FM noise conversion in PLLs incorporating a phase-frequency detector. Using this model, we can predict an upper corner frequency for the demodulation bandwidth above which the converted noise from the single-sideband upconverter becomes the dominant noise source and therefore begins to deteriorate the overall system performance. The approach is validated by both electrical and AFM measurements obtained with a PCB-based prototype implementing the proposed demodulator architecture.

  15. Fabrication of carbon nanotube AFM probes using the Langmuir-Blodgett technique.

    PubMed

    Lee, Jae-Hyeok; Kang, Won-Seok; Choi, Bung-Sam; Choi, Sung-Wook; Kim, Jae-Ho

    2008-09-01

    Carbon nanotube (CNT)-tipped atomic force microscopy (AFM) probes have shown a significant potential for obtaining high-resolution imaging of nanostructure and biological materials. In this paper, we report a simple method to fabricate single-walled carbon nanotube (SWNT) nanoprobes for AFM using the Langmuir-Blodgett (LB) technique. Thiophenyl-modified SWNTs (SWNT-SHs) through amidation of SWNTs in chloroform allowed to be spread and form a stable Langmuir monolayer at the water/air interface. A simple two-step transfer process was used: (1) dipping conventional AFM probes into the Langmuir monolayer and (2) lifting the probes from the water surface. This results in the attachment of SWNTs onto the tips of AFM nanoprobes. We found that the SWNTs assembled on the nanoprobes were well-oriented and robust enough to maintain their shape and direction even after successive scans. AFM measurements of a nano-porous alumina substrate and deoxyribonucleic acid using SWNT-modified nanoprobes revealed that the curvature diameter of the nanoprobes was less than 3 nm and a fine resolution was obtained than that from conventional AFM probes. We also demonstrate that the LB method is a scalable process capable of simultaneously fabricating a large number of SWNT-modified nanoprobes.

  16. Optical fibre cantilever sensor for biological application

    NASA Astrophysics Data System (ADS)

    Li, J.; Zhou, Y. X.; Patterson, G.; Shu, W. M.; Maier, R. R. J.; Fowler, R.; Hand, D. P.; MacPherson, W. N.

    2014-05-01

    Micro-cantilever sensors have shown great promise in a wide range of application are as including chemical and biological sensing. However, many of these devices are based upon a sensor `chip' that requires careful alignment between the cantilever and the read-out system, which can be challenging. Furthermore, optical interrogation typically involves a bulky free-space system. Optical fibre addressed cantilevers have been reported previously in the literature and in this paper we propose techniques to design and fabricate polymer micro-cantilevers for attachment onto the end of standard single mode fibres using laser machining. Low-cost optical sources and a fibre coupled spectrometer are employed to monitor the cantilever deflection and therefore observe biological binding between a species of interest and an activated cantilever. Proof-of-concept experiments show that the sensor is capable of detecting pathogen concentration with down to a level of 105cfu/ml.

  17. Novel Polymer Linkers for Single Molecule AFM Force Spectroscopy

    PubMed Central

    Tong, Zenghan; Mikheikin, Andrey; Krasnoslobodtsev, Alexey; Lv, Zhengjian; Lyubchenko, Yuri L.

    2013-01-01

    Flexible polymer linkers play an important role in various imaging and probing techniques that require surface immobilization, including atomic force microscopy (AFM). In AFM force spectroscopy, polymer linkers are necessary for the covalent attachment of molecules of interest to the AFM tip and the surface. The polymer linkers tether the molecules and provide their proper orientation in probing experiments. Additionally, the linkers separate specific interactions from nonspecific short-range adhesion and serve as a reference point for the quantitative analysis of single molecule probing events. In this report, we present our results on the synthesis and testing of a novel polymer linker and the identification of a number of potential applications for its use in AFM force spectroscopy experiments. The synthesis of the linker is based on the well-developed phosphoramidate (PA) chemistry that allows the routine synthesis of linkers with predetermined lengths and PA composition. These linkers are homogeneous in length and can be terminated with various functional groups. PA linkers with different functional groups were synthesized and tested in experimental systems utilizing different immobilization chemistries. We probed interactions between complementary DNA oligonucleotides; DNA and protein complexes formed by the site-specific binding protein SfiI; and interactions between amyloid peptide (Aβ42). The results of the AFM force spectroscopy experiments validated the feasibility of the proposed approach for the linker design and synthesis. Furthermore, the properties of the tether (length, functional groups) can be adjusted to meet the specific requirements for different force spectroscopy experiments and system characteristics, suggesting that it could be used for a large number of various applications. PMID:23624104

  18. TIP list

    SciTech Connect

    Ludwig, M E

    2006-06-22

    Subcontractors and vendors providing services, including the installation of purchased goods, are required to complete a TIP List. This list does not include every Environment, Safety, and Health (ES&H) related concern at LLNL. It is intended to highlight major concerns common to most on-site service activities.

  19. Technology Tips

    ERIC Educational Resources Information Center

    Santos-Trigo, Manuel

    2004-01-01

    A dynamic program for geometry called Cabri Geometry II is used to examine properties of figures like triangles and make connections with other mathematical ideas like ellipse. The technology tip includes directions for creating such a problem with technology and suggestions for exploring it.

  20. Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach

    NASA Astrophysics Data System (ADS)

    Stark, Martin; Guckenberger, Reinhard; Stemmer, Andreas; Stark, Robert W.

    2005-12-01

    Dynamic atomic force microscopy (AFM) offers many opportunities for the characterization and manipulation of matter on the nanometer scale with a high temporal resolution. The analysis of time-dependent forces is basic for a deeper understanding of phenomena such as friction, plastic deformation, and surface wetting. However, the dynamic characteristics of the force sensor used for such investigations are determined by various factors such as material and geometry of the cantilever, detection alignment, and the transfer characteristics of the detector. Thus, for a quantitative investigation of surface properties by dynamic AFM an appropriate system identification procedure is required, characterizing the force sensor beyond the usual parameters spring constant, quality factor, and detection sensitivity. Measurement of the transfer function provides such a characterization that fully accounts for the dynamic properties of the force sensor. Here, we demonstrate the estimation of the transfer function in a bandwidth of 1MHz from experimental data. To this end, we analyze the signal of the vibrations induced by snap-to-contact and snap-off-contact events. For the free cantilever, we determine both a parameter-free estimate [empirical transfer function estimate (ETFE)] and a parametric estimate of the transfer function. For the surface-coupled cantilever the ETFE is obtained. These identification procedures provide an intrinsic calibration as they dispense largely with a priori knowledge about the force sensor.

  1. Probing the PEDOT:PSS/cell interface with conductive colloidal probe AFM-SECM

    NASA Astrophysics Data System (ADS)

    Knittel, P.; Zhang, H.; Kranz, C.; Wallace, G. G.; Higgins, M. J.

    2016-02-01

    Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive colloid under physiological conditions. Moreover, such colloids can be modified by electrochemical polymerization resulting, e.g. in conductive polymer-coated spheres, which in addition may be loaded with specific dopants. In contrast to other AFM-based single cell force spectroscopy measurements, these probes allow adhesion measurements at the cell-biomaterial interface on multiple cells in a rapid manner while the properties of the polymer can be changed by applying a bias. In addition, spatially resolved electrochemical information e.g., oxygen reduction can be obtained simultaneously. Conductive colloid AFM-SECM probes modified with poly(3,4-ethylenedioxythiophene) doped with polystyrene sulfonate (PEDOT:PSS) are used for single cell force measurements in mouse fibroblasts and single cell interactions are investigated as a function of the applied potential.Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive colloid under physiological conditions. Moreover, such colloids can be modified by electrochemical polymerization resulting, e.g. in conductive polymer-coated spheres, which in addition may be loaded with specific dopants. In contrast to other AFM-based single cell force spectroscopy measurements, these probes allow adhesion measurements at the cell-biomaterial interface on multiple cells in a rapid manner while the properties of the polymer can be changed by applying a bias. In addition, spatially resolved electrochemical

  2. Calibration of the torsional and lateral spring constants of cantilever sensors.

    PubMed

    Parkin, John D; Hähner, Georg

    2014-06-01

    A method suitable for the calibration of the spring constants of all torsional and lateral eigenmodes of micro- and nanocantilever sensors is described. Such sensors enable nanomechanical measurements and the characterization of nanomaterials, for example with atomic force microscopy. The method presented involves the interaction of a flow of fluid from a microchannel with the cantilever beam. Forces imparted by the flow cause the cantilever to bend and induce a measurable change of the torsional and lateral resonance frequencies. From the frequency shifts the cantilever spring constants can be determined. The method does not involve physical contact between the cantilever or its tip and a hard surface. As such it is non-invasive and does not risk damage to the cantilever. Experimental data is presented for two rectangular microcantilevers with fundamental flexural spring constants of 0.046 and 0.154 N m(-1). The experimentally determined torsional stiffness values are compared with those obtained by the Sader method. We demonstrate that the torsional spring constants can be readily calibrated using the method with an accuracy of around 15%.

  3. Response of long, flexible cantilever beams applied root motions. [spacecraft structures

    NASA Technical Reports Server (NTRS)

    Fralich, R. W.

    1976-01-01

    Results are presented for an analysis of the response of long, flexible cantilever beams to applied root rotational accelerations. Maximum values of deformation, slope, bending moment, and shear are found as a function of magnitude and duration of acceleration input. Effects of tip mass and its eccentricity and rotatory inertia on the response are also investigated. It is shown that flexible beams can withstand large root accelerations provided the period of applied acceleration can be kept small relative to the beam fundamental period.

  4. Cantilevers orthodontics forces measured by fiber sensors

    NASA Astrophysics Data System (ADS)

    Schneider, Neblyssa; Milczewski, Maura S.; de Oliveira, Valmir; Guariza Filho, Odilon; Lopes, Stephani C. P. S.; Kalinowski, Hypolito J.

    2015-09-01

    Fibers Bragg Gratings were used to evaluate the transmission of the forces generates by orthodontic mechanic based one and two cantilevers used to move molars to the upright position. The results showed levels forces of approximately 0,14N near to the root of the molar with one and two cantilevers.

  5. High-speed force mapping on living cells with a small cantilever atomic force microscope

    SciTech Connect

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  6. High-speed force mapping on living cells with a small cantilever atomic force microscope.

    PubMed

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed. PMID:25085142

  7. High-speed force mapping on living cells with a small cantilever atomic force microscope

    NASA Astrophysics Data System (ADS)

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-01

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10-100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  8. Study of relaxation and transport processes by means of AFM based dielectric spectroscopy

    SciTech Connect

    Miccio, Luis A.

    2014-05-15

    Since its birth a few years ago, dielectric spectroscopy studies based on atomic force microscopy (AFM) have gained a growing interest. Not only the frequency and temperature ranges have become broader since then but also the kind of processes that can be studied by means of this approach. In this work we analyze the most adequate experimental setup for the study of several dielectric processes with a spatial resolution of a few nanometers by using force mode AFM based dielectric spectroscopy. Proof of concept experiments were performed on PS/PVAc blends and PMMA homopolymer films, for temperatures ranging from 300 to 400 K. Charge transport processes were also studied by this approach. The obtained results were analyzed in terms of cantilever stray contribution, film thickness and relaxation strength. We found that the method sensitivity is strongly coupled with the film thickness and the relaxation strength, and that it is possible to control it by using an adequate experimental setup.

  9. Resonance response of scanning force microscopy cantilevers

    SciTech Connect

    Chen, G.Y.; Warmack, R.J.; Thundat, T.; Allison, D.P. ); Huang, A. )

    1994-08-01

    A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor [ital Q]. Helium has the lowest viscosity, resulting in the highest [ital Q], and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.

  10. Oscillations of end loaded cantilever beams

    NASA Astrophysics Data System (ADS)

    Macho-Stadler, E.; Elejalde-García, M. J.; Llanos-Vázquez, R.

    2015-09-01

    This article presents several simple experiments based on changing transverse vibration frequencies in a cantilever beam, when acted on by an external attached mass load at the free end. By using a mechanical wave driver, available in introductory undergraduate laboratories, we provide various experimental results for end loaded cantilever beams that fit reasonably well into a linear equation. The behaviour of the cantilever beam’s weak-damping resonance response is studied for the case of metal resonance strips. As the mass load increases, a more pronounced decrease occurs in the fundamental frequency of beam vibration. It is important to note that cantilever construction is often used in architectural design and engineering construction projects but current analysis also predicts the influence of mass load on the sound generated by musical free reeds with boundary conditions similar to a cantilever beam.

  11. Use of biaxially oriented polypropylene film for evaluating and cleaning contaminated atomic force microscopy probe tips: An application to blind tip reconstruction

    NASA Astrophysics Data System (ADS)

    Nie, H.-Y.; Walzak, M. J.; McIntyre, N. S.

    2002-11-01

    An atomic force microscopy (AFM) image of a surface is basically a convolution of the probe tip geometry and the surface features; it is important to know this tip effect to ensure that an image truly reflects the surface features. We have found that a biaxially oriented polypropylene (BOPP) film is suitable for checking tip performance and for cleaning contaminated tips, thus making it possible to collect images of the same area of a BOPP film surface before and after the tip was cleaned. Therefore, the difference between the two different images is solely due to the contamination of the tip. We took advantage of our ability to collect AFM images of the same area using the same tip, in one instance, contaminated and, in the other, after being cleaned. First we used blind reconstruction on the image collected using the contaminated tip. Blind tip reconstruction allows one to extract the geometry of the tip from a given image. Once we had estimated the geometry of the contaminated tip, we used it to simulate the tip effect using the image collected using the cleaned tip. By comparing the simulation result with the image collected using the contaminated tip we showed that the blind reconstruction routine works well. Prior to this, there was no de facto method for testing blind reconstruction algorithms.

  12. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    SciTech Connect

    Liu Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-15

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  13. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method.

    PubMed

    Liu, Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-01

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  14. Complete noise analysis of a simple force spectroscopy AFM setup and its applications to study nanomechanics of mammalian Notch 1 protein

    NASA Astrophysics Data System (ADS)

    Dey, Ashim; Szoszkiewicz, Robert

    2012-05-01

    We describe a complete noise analysis and application of a custom made AFM force spectroscopy setup on pulling a recombinant protein with an NRR domain of mouse Notch 1. Our table top AFM setup is affordable, has an open architecture, and is easily transferable to other laboratories. Its calculated noise characteristics are dominated by the Brownian noise with 2% non-Brownian components integrated over the first thermally induced resonance of a typical cantilever. For a typical SiN cantilever with a force constant of ˜15 pN nm-1 and in water the force sensitivity and resolution are less than 10 pN, and the corresponding deflection sensitivities are less than 100 pm Hz-1/2. Also, we obtain a sub-ms time resolution in detecting the protein length change, and only few ms cantilever response times as measured in the force clamp mode on a well-known protein standard. Using this setup we investigate force-induced conformational transitions in the NRR region of a mouse Notch 1. Notch is an important protein related to leukemia and breast cancers in humans. We demonstrate that it is feasible to develop AFM-based studies of the force-induced conformational transitions in Notch. Our results match recent steered molecular dynamics simulations of the NRR unfolding and constitute a first step towards a detailed study of Notch activation with AFM.

  15. Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid

    SciTech Connect

    Nishida, Shuhei; Kobayashi, Dai; Sakurada, Takeo; Nakazawa, Tomonori; Hoshi, Yasuo; Kawakatsu, Hideki

    2008-12-15

    The authors present an optically based method combining photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid. The frequency spectrum of a silicon cantilever measured in water over frequencies ranging up to 10 MHz shows that the method allows us to excite and detect higher modes, from fundamental to fifth flexural, without enhancing spurious resonances. By reducing the tip oscillation amplitude using higher modes, the average tip-sample force gradient due to chemical bonds is effectively increased to achieve high-spatial-resolution imaging in liquid. The method's performance is demonstrated by atomic resolution imaging of a mica surface in water obtained using the second flexural mode with a small tip amplitude of 99 pm; individual atoms on the surface with small height differences of up to 60 pm are clearly resolved.

  16. On CD-AFM bias related to probe bending

    NASA Astrophysics Data System (ADS)

    Ukraintsev, V. A.; Orji, N. G.; Vorburger, T. V.; Dixson, R. G.; Fu, J.; Silver, R. M.

    2012-03-01

    Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on uncontrolled and significant probe-to-probe bias variation during linewidth and sidewall angle measurements [1,2]. Results obtained in this work suggest that probe bending can be on the order of several nanometers and thus potentially can explain much of the observed CD-AFM probe-to-probe bias variation. We have developed and experimentally tested one-dimensional (1D) and two-dimensional (2D) models to describe the bending of cylindrical probes. An earlier 1D bending model reported by Watanabe et al. [3] was refined. Contributions from several new phenomena were considered, including: probe misalignment, diameter variation near the carbon nanotube tip (CNT) apex, probe bending before snapping, distributed van der Waals-London force, etc. The methodology for extraction of the Hamaker probe-surface interaction energy from experimental probe bending data was developed. To overcome limitations of the 1D model, a new 2D distributed force (DF) model was developed. Comparison of the new model with the 1D single point force (SPF) model revealed about 27 % difference in probe bending bias between the two. A simple linear relation between biases predicted by the 1D SPF and 2D DF models was found. This finding simplifies use of the advanced 2D DF model of probe bending in various CD-AFM applications. New 2D and three-dimensional (3D) CDAFM data analysis software is needed to take full advantage of the new bias correction modeling capabilities.

  17. On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy.

    PubMed

    Passeri, D; Rossi, M; Vlassak, J J

    2013-05-01

    Accurate quantitative elastic modulus measurements using contact resonance atomic force microscopy require the calibration of geometrical and mechanical properties of the tip as well as the choice of a suitable model for describing the cantilever-tip-sample system. In this work, we demonstrate with both simulations and experiments that the choice of the model influences the results of the calibration. Neglecting lateral force results in the underestimation of the tip indentation modulus and in the overestimation of the tip-sample contact radius. We propose a new approach to the calibration and data analysis, where lateral forces and cantilever inclination are neglected (which simplifies the calculations) and the tip parameters are assumed as fictitious.

  18. Factors influencing elastic stresses in double cantilever beam specimens

    NASA Technical Reports Server (NTRS)

    Crews, J. H., Jr.; Shivakumar, K. N.; Raju, I. S.

    1986-01-01

    An elastic stress analysis was conducted for a double cantilever beam (DCB) specimen using finite-element methods. The purpose of this study was to identify the important parameters that influence stresses ahead of the delamination front. The study focused on an aluminum DCB specimen, typical of adhesively-bonded joints, and on a graphite/epoxy specimen representing a cocured composite. Opening mode sigma sub y stresses ahead of the crack tip were calculated and compared with those for a monolithic reference specimen. Beyond the singularity-dominated region very near the crack tip, the sigma sub y distribution was elevated compared to the monolithic case. Both the adhesive thickness and the adherend transverse (thickness-direction) stiffness were found to influence the elevation of sigma sub y. In contrast, adherend thickness and longitudinal stiffness has very little effect on this stress distribution. Estimates for adhesive yielding beyond the aluminum DCB crack tip showed that both the area and height of the plastic zone increased to a peak value for increasing adhesive thicknesses. Results from this study would provide insight for comparing data from different DCB specimens and for designing new DCB specimens.

  19. Factors influencing elastic stresses in double cantilever beam specimens

    NASA Technical Reports Server (NTRS)

    Crews, J. H., Jr.; Shivakumar, K. N.; Raju, I. S.

    1988-01-01

    An elastic stress analysis was conducted for a double cantilever beam (DCB) specimen using finite-element methods. The purpose of this study was to identify the important parameters that influence stresses ahead of the delamination front. The study focused on an aluminum DCB specimen, typical of adhesively-bonded joints, and on a graphite/epoxy specimen representing a cocured composite. Opening mode sigma sub y stresses ahead of the crack tip were calculated and compared with those for a monolithic reference specimen. Beyond the singularity-dominated region very near the crack tip, the sigma sub y distribution was elevated compared to the monolithic case. Both the adhesive thickness and the adherend transverse (thickness-direction) stiffness were found to influence the elevation of sigma sub y. In contrast, adherend thickness and longitudinal stiffness has very little effect on this stress distribution. Estimates for adhesive yielding beyond the aluminum DCB crack tip showed that both the area and height of the plastic zone increased to a peak value for increasing adhesive thicknesses. Results from this study would provide insight for comparing data from different DCB specimens and for designing new DCB specimens.

  20. Electromechanical decoupled model for cantilever-beam piezoelectric energy harvesters

    NASA Astrophysics Data System (ADS)

    Tan, T.; Yan, Z.; Hajj, M.

    2016-09-01

    Analysis of cantilever-based piezoelectric energy harvesting systems is usually performed using coupled equations that represent the mechanical displacement and the voltage output. These equations are then solved simultaneously. In contrast to this representation, we use analytical solutions of the governing equation to derive an algebraic equation of the power as a function of the beam displacement, electromechanical coefficients, and the load resistance. Such an equation can be more useful in the design of such harvesters. Particularly, the mechanical displacement is computed from a mechanical governing equation with modified natural frequency and damping ratio that account for the electromechanical coupling. The voltage and the harvested power are then obtained by relating them directly to the mechanical displacement. We validate the proposed analysis by comparing its solution including the tip displacement and harvested power with those of numerical simulations of the governing equations. To demonstrate the generality of the proposed approach, we consider the cases of base excitation, galloping, and autoparametric vibration. The model proposed in this study simplifies the electromechanical coupling problem for practical applications of cantilever-beam piezoelectric energy harvesting systems.

  1. A software tool for STED-AFM correlative super-resolution microscopy

    NASA Astrophysics Data System (ADS)

    Koho, Sami; Deguchi, Takahiro; Löhmus, Madis; Näreoja, Tuomas; Hänninen, Pekka E.

    2015-03-01

    Multi-modal correlative microscopy allows combining the strengths of several imaging techniques to provide unique contrast. However it is not always straightforward to setup instruments for such customized experiments, as most microscope manufacturers use their own proprietary software, with limited or no capability to interface with other instruments - this makes correlation of the multi-modal data extremely challenging. We introduce a new software tool for simultaneous use of a STimulated Emission Depletion (STED) microscope with an Atomic Force Microscope (AFM). In our experiments, a Leica TCS STED commercial super-resolution microscope, together with an Agilent 5500ilm AFM microscope was used. With our software, it is possible to synchronize the data acquisition between the STED and AFM instruments, as well as to perform automatic registration of the AFM images with the super-resolution STED images. The software was realized in LabVIEW; the registration part was also implemented as an ImageJ script. The synchronization was realized by controlling simple trigger signals, also available in the commercial STED microscope, with a low-cost National Instruments USB-6501 digital I/O card. The registration was based on detecting the positions of the AFM tip inside the STED fieldof-view, which were then used as registration landmarks. The registration should work on any STED and tip-scanning AFM microscope combination, at nanometer-scale precision. Our STED-AFM correlation method has been tested with a variety of nanoparticle and fixed cell samples. The software will be released under BSD open-source license.

  2. Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching method

    PubMed Central

    2014-01-01

    This letter presents a novel atomic force microscopy (AFM)-based nanomanufacturing method combining the tip scanning with the high-precision stage movement to fabricate nanochannels with ladder nanostructure at the bottom by continuous scanning with a fixed scan size. Different structures can be obtained according to the matching relation of the tip feeding velocity and the precision stage moving velocity. This relationship was first studied in detail to achieve nanochannels with different ladder nanostructures at the bottom. Machining experiments were then performed to fabricate nanochannels on an aluminum alloy surface to demonstrate the capability of this AFM-based fabrication method presented in this study. Results show that the feed value and the tip orientation in the removing action play important roles in this method which has a significant effect on the machined surfaces. Finally, the capacity of this method to fabricate a large-scale nanochannel was also demonstrated. This method has the potential to advance the existing AFM tip-based nanomanufacturing technique of the formation these complex structures by increasing the removal speed, simplifying the processing procedure and achieving the large-scale nanofabrication. PMID:24940171

  3. Development of double-cantilever infrared detectors

    NASA Astrophysics Data System (ADS)

    Huang, Shusen

    Detection and imaging of infrared (IR) radiation are of great importance to a variety of military and civilian applications. Recent advances in microelectromechanical systems (MEMS) have led to the development of uncooled cantilever IR focal plane arrays (FPAs), which function based on the bending of bimaterial cantilevers upon the absorption of IR energy. In this dissertation, capacitive-based double-cantilever IR FPAs, which have a potential of reaching a noise-equivalent temperature difference (NETD) approaching the theoretical limit, i.e., <10 mK, are developed. Each pixel in the proposed double-cantilever IR FPAs consists of two facing bimaterial cantilevers: one bends upward and the other downward upon IR radiation, resulting in an extremely high sensitivity of the device. It is predicted that the NETD of the double-cantilever IR FPAs is about 60% of the current single-cantilever IR FPAs, which is a significant improvement of device performance. A surface micromachining module with polyimide as a sacrificial material is developed for the fabrication of both simplified single- and double-cantilever FPAs. It is found the as-fabricated FPAs are curved because of the imbalanced residual stresses (strains) in thin films developed in the fabrication processes. In this dissertation, therefore, the general relationship between the residual strain and the resultant elastic bending deformation is modeled. A thorough investigation of residual stresses in cantilever IR materials and structures is then conducted using the theory developed in this dissertation. Furthermore, thermal-cycling experiments reveal that the residual stresses in IR materials, i.e., plasma-enhanced chemical vapor deposited (PECVD) SiNx and electron beam (Ebeam) AI, can be significantly modified by thermal annealing. Therefore, an engineering approach to flattening IR FPAs is developed by using rapid thermal annealing (RTA). Finally, this dissertation demonstrates the thermal detection of cantilever

  4. Improved cantilever profiles for sensor elements

    NASA Astrophysics Data System (ADS)

    Fernando, Sanchitha; Austin, Michael; Chaffey, Jason

    2007-12-01

    The problem of simultaneously enhancing sensitivity and noise immunity of microcantilevers is investigated. The dependence of deflection and resonant frequency of a microcantilever on its dimensions is studied. A principle to increase deflection and resonant frequency simultaneously is established. Several cantilevers agreeing with this principle are investigated using analytical models and are compared with FEM simulations. Using these results, a cantilever profile that achieves a larger deflection and a larger resonant frequency compared with uniform cantilevers is proposed to be used in sensor elements.

  5. Self-reciprocating radioisotope-powered cantilever

    NASA Astrophysics Data System (ADS)

    Li, Hui; Lal, Amit; Blanchard, James; Henderson, Douglass

    2002-07-01

    A reciprocating cantilever utilizing emitted charges from a millicurie radioisotope thin film is presented. The actuator realizes a direct collected-charge-to-motion conversion. The reciprocation is obtained by self-timed contact between the cantilever and the radioisotope source. A static model balancing the electrostatic and mechanical forces from an equivalent circuit leads to an analytical solution useful for device characterization. Measured reciprocating periods agree with predicted values from the analytical model. A scaling analysis shows that microscale arrays of such cantilevers provide an integrated sensor and actuator platform.

  6. Piezoresistor-equipped fluorescence-based cantilever probe for near-field scanning

    NASA Astrophysics Data System (ADS)

    Kan, Tetsuo; Matsumoto, Kiyoshi; Shimoyama, Isao

    2007-08-01

    Scanning near-field optical microscopes (SNOMs) with fluorescence-based probes are promising tools for evaluating the optical characteristics of nanoaperture devices used for biological investigations, and this article reports on the development of a microfabricated fluorescence-based SNOM probe with a piezoresistor. The piezoresistor was built into a two-legged root of a 160-μm-long cantilever. To improve the displacement sensitivity of the cantilever, the piezoresistor's doped area was shallowly formed on the cantilever surface. A fluorescent bead, 500nm in diameter, was attached to the bottom of the cantilever end as a light-intensity-sensitive material in the visible-light range. The surface of the scanned sample was simply detected by the probe's end being displaced by contact with the sample. Measuring displacements piezoresistively is advantageous because it eliminates the noise arising from the use of the optical-lever method and is free of any disturbance in the absorption or the emission spectrum of the fluorescent material at the probe tip. The displacement sensitivity was estimated to be 6.1×10-6nm-1, and the minimum measurable displacement was small enough for near-field measurement. This probe enabled clear scanning images of the light field near a 300×300nm2 aperture to be obtained in the near-field region where the tip-sample distance is much shorter than the light wavelength. This scanning result indicates that the piezoresistive way of tip-sample distance regulation is effective for characterizing nanoaperture optical devices.

  7. Single-Crystal Diamond Nanowire Tips for Ultrasensitive Force Microscopy.

    PubMed

    Tao, Y; Degen, C L

    2015-12-01

    We report the fabrication, integration, and assessment of sharp diamond tips for ultrasensitive force microscopy experiments. Two types of tips, corresponding to the upper and lower halves of a diamond nanowire, were fabricated by top-down plasma etching from a single-crystalline substrate. The lower, surface-attached halves can be directly integrated into lithographically defined nanostructures, like cantilevers. The upper, detachable halves result in diamond nanowires with a tunable diameter (50-500 nm) and lengths of a few microns. Tip radii were around 10 nm and tip apex angles around 15°. We demonstrate the integration of diamond nanowires for use as scanning tips onto ultrasensitive pendulum-style silicon cantilevers. We find the noncontact friction and frequency jitter to be exceptionally low, with no degradation in the intrinsic mechanical quality factor (Q ≈ 130,000) down to tip-to-surface distances of about 10 nm. Our results are an encouraging step toward further improvement of the sensitivity and resolution of force-detected magnetic resonance imaging. PMID:26517172

  8. Double sided surface stress cantilever sensor

    NASA Astrophysics Data System (ADS)

    Rasmussen, P. A.; Grigorov, A. V.; Boisen, A.

    2005-05-01

    Micromachined cantilevers, originally developed for use in atomic force microscopy, are gaining more and more interest as biochemical sensors, where the way in which the binding of chemical species changes the mechanical properties of the cantilever is utilized. Mass and stiffness changes are measured on resonating structures (Cherian and Thundat 2002 Appl. Phys. Lett. 80 2219-21 Gupta et al 2004 Appl. Phys. Lett. 84 1976-8), whereas changes in surface energy from the binding event are measured as static deflections of cantilevers (Savran et al 2004 Anal. Chem. 76 3194-8). The latter measurement type is referred to as a surface stress sensor and it is the description of a new and more sensitive cantilever surface stress measurement technique that is the topic of this paper.

  9. Generation of squeezing: magnetic dipoles on cantilevers

    NASA Astrophysics Data System (ADS)

    Seok, Hyojun; Singh, Swati; Steinke, Steven; Meystre, Pierre

    2011-05-01

    We investigate the generation of motional squeezed states in a nano-mechanical cantilever. Our model system consists of a nanoscale cantilever - whose center-of-mass motion is initially cooled to its quantum mechanical ground state - magnetically coupled a classically driven mechanical tuning fork. We show that the magnetic dipole-dipole interaction can produce significant phonon squeezing of the center-of-mass motion of the cantilever, and evaluate the effect of various dissipation channels, including the coupling of the cantilever to a heat bath and phase and amplitude fluctuations in the oscillating field driving the tuning fork. US National Science Foundation, the US Army Research Office, DARPA ORCHID program through a grant from AFOSR.

  10. AFM-based force microsensor for a microrobot

    NASA Astrophysics Data System (ADS)

    Fatikow, Sergej; Fahlbusch, Stephan

    2001-10-01

    Microrobots are the result of increasing research activities at the border between microsystem technology and robotics. Today already, robots with dimensions of a few cubic- centimeters can be developed. Like conventional robots, microrobots represent a complex system that usually contains several different types of actuators and sensors. The measurement of gripping forces is the most important sensor application in micromanipulation besides visual servoing to protect the parts from too high surface pressures and thereby damage during the assembly process. Very small forces in the range of 200 (mu) N down to 0.1 (mu) N or even less have to be sensed. Thus, the aim of our current research activities is the development of a high-resolution integrated force microsensor for measuring gripping forces in a microhandling robot. On the one hand, the sensor should be a device for teleoperated manipulation tasks in a flexible microhandling station. On the other hand, typical microhandling operations should to a large extend be automated with the aid of computer-based signal processing of sensor information. The user should be provided with an interface for teleoperated manipulation and an interface for partially automated manipulation of microobjects. In this paper, a concept for the measurement of gripping forces in microrobotics using piezoresistive AFM (atomic force microscope) cantilevers is introduced. Further on, the concept of a microrobot-based SEM station and its applications are presented.

  11. Implementation of a four quadrant optic fibre bundle as a deflection sensor to get rid of heat sources in an AFM head

    NASA Astrophysics Data System (ADS)

    Boukellal, Younes; Ducourtieux, Sebastien

    2015-09-01

    In the frame of developing a thermally passive atomic force microscope head, a new kind of 2D displacement sensor based on a four quadrant optic fibre bundle has been implemented. The aim is to replace the quad cell photodiode used in the optical beam deflection method to detect cantilever deflection. The use of the bundle as a position sensor has already been modelled and experimentally evaluated in a previous work. This article reports on the implementation of the bundle as a deflection sensor for atomic force microscopy. The main motivation for such a development was to reduce the heat sources in the instrument. To reach this goal the photodiode and its conditioning circuit used for the measurement of cantilever deflection has been externalized from the AFM head. For the same reason, the laser diode and its electronic driver have been deported using optic fibre. To test the AFM head prototype in real conditions, approach curves and AFM images have been performed. The results show that the bundle is very well suited for AFM applications that require very low heat sources such as metrological AFM where each error source has to be managed.

  12. Fatigue fracture of the stem-cement interface with a clamped cantilever beam test.

    PubMed

    Heuer, D A; Mann, K A

    2000-12-01

    A clamped cantilever beam test was developed to determine the fatigue crack propagation rate of the CoCr alloy/PMMA cement interface at high crack tip phase angles. A combination of finite element and experimental methods was used to determine the fatigue crack growth rates of two different CoCr alloy/PMMA cement surfaces. A crack tip phase angle of 69 deg was found, indicating that loading at the crack tip was mixed-mode with a large degree of in-plane shear loading. The energy required to propagate a crack at the interface was much greater for the plasma-sprayed CoCr surface when compared to the PMMA-precoated satin finish (p < 0.001). Both interface surfaces could be modeled using a Paris fatigue crack growth law over crack propagation rates of 10(-4) to 10(-9) m/cycle.

  13. Mechanical properties of graphene cantilever from atomic force microscopy and density functional theory.

    PubMed

    Rasuli, R; Iraji Zad, A; Ahadian, M M

    2010-05-01

    We have studied the mechanical properties of a few-layer graphene cantilever (FLGC) using atomic force microscopy (AFM). The mechanical properties of the suspended FLGC over an open hole have been derived from the AFM data. Force displacement curves using the Derjaguin-Müller-Toporov (DMT) and the massless cantilever beam models yield a Young modulus of E(c) approximately 37, E(a) approximately 0.7 TPa and a Hamakar constant of approximately 3 x 10( - 18) J. The threshold force to shear the FLGC was determined from a breaking force and modeling. In addition, we studied a graphene nanoribbon (GNR), which is a system similar to the FLGC; using density functional theory (DFT). The in-plane Young's modulus for the GNRs were calculated from the DFT outcomes approximately 0.82 TPa and the results were compared with the experiment. We found that the Young's modulus and the threshold shearing force are dependent on the direction of applied force and the values are different for zigzag edge and armchair edge GNRs.

  14. Nanoscale Mapping of Dielectric Properties of Nanomaterials from Kilohertz to Megahertz Using Ultrasmall Cantilevers.

    PubMed

    Cadena, Maria J; Sung, Seung Hyun; Boudouris, Bryan W; Reifenberger, Ronald; Raman, Arvind

    2016-04-26

    Electrostatic force microscopy (EFM) is often used for nanoscale dielectric spectroscopy, the measurement of local dielectric properties of materials as a function of frequency. However, the frequency range of atomic force microscopy (AFM)-based dielectric spectroscopy has been limited to a few kilohertz by the resonance frequency and noise of soft microcantilevers used for this purpose. Here, we boost the frequency range of local dielectric spectroscopy by 3 orders of magnitude from a few kilohertz to a few megahertz by developing a technique that exploits the high resonance frequency and low thermal noise of ultrasmall cantilevers (USCs). We map the frequency response of the real and imaginary components of the capacitance gradient (∂C(ω)/∂z) by using second-harmonic EFM and a theoretical model, which relates cantilever dynamics to the complex dielectric constant. We demonstrate the method by mapping the nanoscale dielectric spectrum of polymer-based materials for organic electronic devices. Beyond offering a powerful extension to AFM-based dielectric spectroscopy, the approach also allows the identification of electrostatic excitation frequencies which affords high dielectric contrast on nanomaterials.

  15. Cantilever noise in off-cantilever-resonance force-detected nuclear magnetic resonance

    NASA Astrophysics Data System (ADS)

    Harrell, Lee E.; Thurber, Kent R.; Smith, Doran D.

    2004-03-01

    Early work in force-detected nuclear magnetic resonance (FD-NMR) and magnetic resonance force microscopy was restricted to nuclei with a relatively large gyromagnetic ratio γ. Increasingly, as researchers look to apply FD-NMR to practical problems, observing isotopes with a small γ is becoming necessary. The small γ of these isotopes places severe restrictions on the radio frequency field strength necessary to flip the sample spins at practical cantilever frequencies by adiabatic rapid passage. These restrictions led us to investigate the feasibility of observing FD-NMR by flipping sample spins at a rate well below the cantilever frequency. In this article we show that there is no increase in thermomechanical force noise in off-cantilever-resonance FD-NMR relative to on-cantilever-resonance work. Further, we show that working off-cantilever resonance can reduce artifacts and decrease data acquisition time. The major disadvantage to working off-cantilever resonance—reduced cantilever response—increases the importance of low noise detection of cantilever oscillation.

  16. Controlled AFM detachments and movement of nanoparticles: gold clusters on HOPG at different temperatures.

    PubMed

    Tripathi, Manoj; Paolicelli, Guido; D'Addato, Sergio; Valeri, Sergio

    2012-06-22

    The effect of temperature on the onset of movement of gold nanoclusters (diameter 27 nm) deposited on highly oriented pyrolytic graphite (HOPG) has been studied by atomic force microscopy (AFM) techniques. Using the AFM with amplitude modulation (tapping mode AFM) we have stimulated and controlled the movement of individual clusters. We show how, at room temperature, controlled detachments and smooth movements can be obtained for clusters having dimensions comparable to or smaller than the tip radius. Displacement is practically visible in real time and it can be started and stopped easily by adjusting only one parameter, the tip amplitude oscillation. Analysing the energy dissipation signal at the onset of nanocluster sliding we evaluated a detachment threshold energy as a function of temperature in the range 300-413 K. We also analysed single cluster thermal induced displacement and combining this delicate procedure with AFM forced movement behaviour we conclude that detachment threshold energy is directly related to the activation energy of nanocluster diffusion and it scales linearly with temperature as expected for a single-particle thermally activated process.

  17. A performance-enhanced energy harvester for low frequency vibration utilizing a corrugated cantilevered beam

    NASA Astrophysics Data System (ADS)

    Kim, In-Ho; Jin, SeungSeop; Jang, Seon-Jun; Jung, Hyung-Jo

    2014-03-01

    This note proposes a performance-enhanced piezoelectric energy harvester by replacing a conventional flat cantilevered beam with a corrugated beam. It consists of a proof mass and a sinusoidally or trapezoidally corrugated cantilevered beam covered by a polyvinylidene fluoride (PVDF) film. Compared to the conventional energy harvester of the same size, it has a more flexible bending stiffness and a larger bonding area of the PVDF layer, so higher output voltage from the device can be expected. In order to investigate the characteristics of the proposed energy harvester, analytical developments and numerical simulations on its natural frequency and tip displacement are carried out. Shaking table tests are also conducted to verify the performance of the proposed device. It is clearly shown from the tests that the proposed energy harvester not only has a lower natural frequency than an equivalent sized standard energy harvester, but also generates much higher output voltage than the standard one.

  18. Thermal imaging with tapping mode using a bimetal oscillator formed at the end of a cantilever.

    PubMed

    Kim, Sang-Jin; Ono, Takahito; Esashi, Masayoshi

    2009-03-01

    Thermal detection based on the thermal shift of the resonant frequency of a bimetal resonator (Al/Si) is presented and demonstrated. The bimetal oscillator with a tip is fabricated at the end of a commercial silicon cantilever. The bimetal oscillator and the silicon cantilever have a resonance frequency of 441 and 91 kHz, respectively, and the measured temperature coefficients of the resonant frequency are -127x10(-6)/K and -115x10(-6)/K, respectively. It is demonstrated that self-oscillated resonant frequency of the bimetal oscillator changes in response to heat from a microheat source. Simultaneous measurements of topography and temperature profile with the temperature resolution of 0.12 K on a glass substrate heated using a thin chromium film microheater are successfully demonstrated. These results show potential abilities of the mechanical resonant thermal sensor.

  19. Thermal imaging with tapping mode using a bimetal oscillator formed at the end of a cantilever

    NASA Astrophysics Data System (ADS)

    Kim, Sang-Jin; Ono, Takahito; Esashi, Masayoshi

    2009-03-01

    Thermal detection based on the thermal shift of the resonant frequency of a bimetal resonator (Al/Si) is presented and demonstrated. The bimetal oscillator with a tip is fabricated at the end of a commercial silicon cantilever. The bimetal oscillator and the silicon cantilever have a resonance frequency of 441 and 91 kHz, respectively, and the measured temperature coefficients of the resonant frequency are -127×10-6/K and -115×10-6/K, respectively. It is demonstrated that self-oscillated resonant frequency of the bimetal oscillator changes in response to heat from a microheat source. Simultaneous measurements of topography and temperature profile with the temperature resolution of 0.12 K on a glass substrate heated using a thin chromium film microheater are successfully demonstrated. These results show potential abilities of the mechanical resonant thermal sensor.

  20. Active H ∞ control of the vibration of an axially moving cantilever beam by magnetic force

    NASA Astrophysics Data System (ADS)

    Wang, Liang; Chen, Huai-hai; He, Xu-dong

    2011-11-01

    An H ∞ method for the vibration control of an iron cantilever beam with axial velocity using the noncontact force by permanent magnets is proposed in the paper. The transverse vibration equation of the axially moving cantilever beam with a tip mass is derived by D'Alembert's principle and then updated by experiments. An experimental platform and a magnetic control system are introduced. The properties of the force between the magnet and the beam have been determined by theoretic analysis and tests. The H ∞ control strategy for the suppression of the beam transverse vibration by initial deformation excitations is put forward. The control method can be used for the beam with constant length or varying length. Numerical simulation and actual experiments are implemented. The results show that the control method is effective and the simulations fit well with the experiments.

  1. A novel tip-induced local electrical decomposition method for thin GeO films nanostructuring.

    PubMed

    Sheglov, D V; Gorokhov, E B; Volodin, V A; Astankova, K N; Latyshev, A V

    2008-06-18

    Decomposition of germanium monoxide (GeO) films under the impact of an atomic force microscope (AFM) tip was observed for the first time. It is known that GeO is metastable in the solid phase and decomposes into Ge and GeO(2) under thermal annealing or radiation impact. AFM tip treatments allow us to carry out local decomposition. A novel tip-induced local electrical decomposition (TILED) method of metastable GeO films has been developed. Using TILED of 10 nm thin GeO film, Ge nanowires on silicon substrates were obtained.

  2. Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM

    NASA Astrophysics Data System (ADS)

    Yamamoto, S.-I.; Yamada, H.; Matsushige, K.; Ishida, T.; Mizutani, W.; Tokumoto, H.

    1999-08-01

    We have succeeded in measuring the Young's moduli of inorganic films with a diamond tip of 160-200 nm in diameter using magnetic-force-controlled atomic force microscopy (MFC-AFM). The measurement of Young's moduli was carried out by detecting the tip amplitude on the sample with an applied force of 20 nN. This technique was applied successfully to obtain Young's moduli mapping of gold islands with 1 nm thickness and nickel films with 10 nm thickness. We obtained an effective spring constant of 3000 N m -1 on gold and 21 000 N m -1 on nickel using MFC-AFM. We could normalize the effective area of the contact radius between the tip and the sample. A value of 350 GPa was derived for the Young's modulus of the nickel film, indicative of the elasticity of native nickel oxide (NiO 2). This shows that the MFC-AFM technique measures the mechanical properties of a thin layer on top of the sample.

  3. Four-beam model for vibration analysis of a cantilever beam with an embedded horizontal crack

    NASA Astrophysics Data System (ADS)

    Liu, Jing; Zhu, Weidong; Charalambides, Panos G.; Shao, Yimin; Xu, Yongfeng; Wu, Kai; Xiao, Huifang

    2016-01-01

    As one of the main failure modes, embedded cracks occur in beam structures due to periodic loads. Hence it is useful to investigate the dynamic characteristics of a beam structure with an embedded crack for early crack detection and diagnosis. A new four-beam model with local flexibilities at crack tips is developed to investigate the transverse vibration of a cantilever beam with an embedded horizontal crack; two separate beam segments are used to model the crack region to allow opening of crack surfaces. Each beam segment is considered as an Euler-Bernoulli beam. The governing equations and the matching and boundary conditions of the four-beam model are derived using Hamilton's principle. The natural frequencies and mode shapes of the four-beam model are calculated using the transfer matrix method. The effects of the crack length, depth, and location on the first three natural frequencies and mode shapes of the cracked cantilever beam are investigated. A continuous wavelet transform method is used to analyze the mode shapes of the cracked cantilever beam. It is shown that sudden changes in spatial variations of the wavelet coefficients of the mode shapes can be used to identify the length and location of an embedded horizontal crack. The first three natural frequencies and mode shapes of a cantilever beam with an embedded crack from the finite element method and an experimental investigation are used to validate the proposed model. Local deformations in the vicinity of the crack tips can be described by the proposed four-beam model, which cannot be captured by previous methods.

  4. A soft-polymer piezoelectric bimorph cantilever-actuated peristaltic micropump.

    PubMed

    Graf, Neil J; Bowser, Michael T

    2008-10-01

    A peristaltic micropump was fabricated and characterized. The micropump was fabricated using soft lithography, and actuated using piezoelectric bimorph cantilevers. The micropump channel was formed by bonding two layers of PDMS, mixed at 5:1 and 30:1 ratios. The channel was fabricated in the 5:1 layer using replica molding (REM), where a very simple and inexpensive template was made by straddling a 75 microm wire over a glass substrate, followed by covering and smoothing over the wire with a piece of aluminium foil. Not only was this template inexpensive and extremely simple to fabricate, it also created a rounded cross-sectional geometry which is favorable for complete valve shutoff. The cantilevers were driven at Vp=+/-90 V with amplified square wave signals generated by a virtual function generator created in LabVIEW. Connections to the micropump were made by placing capillary tubes in the channel, and then sealed between the two layers of PDMS. Machined aluminium clamps were adhered to the tips of the cantilevers with general purpose adhesive. These clamps allowed for aluminium valves, with finely machined tips of dimensions 3 mm by 200 microm, to be held firmly in place. The variables characterized for this micropump were flow rate, maximum attainable backpressure, free cantilever deflection, valve shutoff, and valve leakage. Three actuation patterns with phase differences of 60, 90, and 120 degrees were compared for flow rate and maximum backpressure. It was determined that the 120 degrees signal outperformed the 60 degrees and 90 degrees signals for both maximum flowrate and maximum attainable backpressure. The maximum and minimum flowrates demonstrated by the micropump were 289 nL min(-1) and 53 nL min(-1), respectively. The maximum backpressure attained was 35 300 Pa. It was also demonstrated that the valves fully closed the channels upon actuation, with minimal observed leakage.

  5. Theoretical and experimental study on the transverse vibration properties of an axially moving nested cantilever beam

    NASA Astrophysics Data System (ADS)

    Duan, Ying-Chang; Wang, Jian-Ping; Wang, Jing-Quan; Liu, Ya-Wen; Shao, Fei

    2014-06-01

    An axially moving nested cantilever beam is a type of time-varying nonlinear system that can be regarded as a cantilever stepped beam. The transverse vibration equation for the axially moving nested cantilever beam with a tip mass is derived by D'Alembert's principle, and the modified Galerkin's method is used to solve the partial differential equation. The theoretical model is modified by adjusting the theoretical beam length with the measured results of its first-order vibration frequencies under various beam lengths. It is determined that the length correction value of the second segment of the nested beam increases as the structural length increases, but the corresponding increase in the amplitude becomes smaller. The first-order decay coefficients are identified by the logarithmic decrement method, and the decay coefficient of the beam decreases with an increase in the cantilever length. The calculated responses of the modified model agree well with the experimental results, which verifies the correctness of the proposed calculation model and indicates the effectiveness of the methods of length correction and damping determination. Further studies on non-damping free vibration properties of the axially moving nested cantilever beam during extension and retraction are investigated in the present paper. Furthermore, the extension movement of the beam leads the vibration displacement to increase gradually, and the instantaneous vibration frequency and the vibration speed decrease constantly. Moreover, as the total mechanical energy becomes smaller, the extension movement of the nested beam remains stable. The characteristics for the retraction movement of the beam are the reverse.

  6. A Novel Dog-Bone Oscillating AFM Probe with Thermal Actuation and Piezoresistive Detection †

    PubMed Central

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-01-01

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments. PMID:25365463

  7. A novel dog-bone oscillating AFM probe with thermal actuation and piezoresistive detection.

    PubMed

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-01-01

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments. PMID:25365463

  8. A low-cost AFM setup with an interferometer for undergraduates and secondary-school students

    NASA Astrophysics Data System (ADS)

    Bergmann, Antje; Feigl, Daniela; Kuhn, David; Schaupp, Manuel; Quast, Günter; Busch, Kurt; Eichner, Ludwig; Schumacher, Jens

    2013-07-01

    Atomic force microscopy (AFM) is an important tool in nanotechnology. This method makes it possible to observe nanoscopic surfaces beyond the resolution of light microscopy. In order to provide undergraduate and secondary-school students with insights into this world, we have developed a very robust low-cost AFM setup with a Fabry-Perot interferometer as a detecting device. This setup is designed to be operated almost completely manually and its simplicity gives access to a profound understanding of the working principle. Our AFM is operated in a constant height mode, i.e. the topography of the sample surface is represented directly by the deflection of the cantilever. Thus, the measuring procedure can be understood even by secondary-school students; furthermore, it is the method with the lowest cost, totalling not more than 10-15 k Euros. Nevertheless, we are able to examine a large variety of sample topographies such as CD and DVD surfaces, IC structures, blood cells, butterfly wings or moth eyes. Furthermore, force-distance curves can be recorded and the tensile moduli of some materials can be evaluated. We present our setup in detail and describe its working principles. In addition, we show various experiments which have already been performed by students.

  9. A novel dog-bone oscillating AFM probe with thermal actuation and piezoresistive detection.

    PubMed

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-10-31

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments.

  10. AFM Bio-Mechanical Investigation of the Taxol Treatment of Breast Cancer Cells

    NASA Astrophysics Data System (ADS)

    Smith, Dylan; Patel, Dipika; Monjaraz, Fernando; Park, Soyeun

    2009-10-01

    Cancerous cells are known to be softer and easier to deform than normal cells. Changes in mechanical properties originate from the alteration of the actin cytoskeleton. The mechanism of cancer treatment using Taxol is related to the stabilization of microtubules. It has been shown that Taxol binds to polymerized tublin, stabilizes it against disassembly, and consequently inhibits cell division. An accurate quantitative study still lacks to relate the microtubule stabilizing effect with the cellular mechanical properties. We utilized our AFM to study changes in elastic properties of treated breast cancer cells. The AFM has several advantages for precise force measurements on a localized region with nanometer lateral dimension. In previous AFM studies, measurable contributions from the underlying hard substrate have been an obstacle to accurately determine the properties on thin samples. We modified our AFM tip to obtain the exact deformation profile as well as reducing the high stresses produced. We have probed depth profiles of mechanical properties of the taxol-treated and untreated cells by varying the indentation depth of the AFM-nanoindenting experiments.

  11. Nanoelectrodes integrated in atomic force microscopy cantilevers for imaging of in situ enzyme activity.

    PubMed

    Kueng, Angelika; Kranz, Christine; Lugstein, Alois; Bertagnolli, Emmerich; Mizaikoff, Boris

    2005-01-01

    For investigation of laterally resolved information on biological activity, techniques for simultaneously obtaining complementary information correlated in time and space are required. In this context, recent developments in scanning probe microscopy are aimed at information on the sample topography and simultaneously on the physical and chemical properties at the nanometer scale. With the integration of submicro- and nanoelectrodes into atomic force microscopy (AFM) probes using microfabrication techniques, an elegant approach combining scanning electrochemical microscopy with AFM is demonstrated. This instrumentation enables simultaneous imaging of topography and obtainment of laterally resolved electrochemical information in AFM tapping mode. Hence, topographical and electrochemical information on soft surfaces (e.g., biological species) and polymers can be obtained. The functionality of tip-integrated electrodes is demonstrated by simultaneous electrochemical and topographical studies of an enzyme-modified micropattern.

  12. Nano Mechanical Machining Using AFM Probe

    NASA Astrophysics Data System (ADS)

    Mostofa, Md. Golam

    Complex miniaturized components with high form accuracy will play key roles in the future development of many products, as they provide portability, disposability, lower material consumption in production, low power consumption during operation, lower sample requirements for testing, and higher heat transfer due to their very high surface-to-volume ratio. Given the high market demand for such micro and nano featured components, different manufacturing methods have been developed for their fabrication. Some of the common technologies in micro/nano fabrication are photolithography, electron beam lithography, X-ray lithography and other semiconductor processing techniques. Although these methods are capable of fabricating micro/nano structures with a resolution of less than a few nanometers, some of the shortcomings associated with these methods, such as high production costs for customized products, limited material choices, necessitate the development of other fabricating techniques. Micro/nano mechanical machining, such an atomic force microscope (AFM) probe based nano fabrication, has, therefore, been used to overcome some the major restrictions of the traditional processes. This technique removes material from the workpiece by engaging micro/nano size cutting tool (i.e. AFM probe) and is applicable on a wider range of materials compared to the photolithographic process. In spite of the unique benefits of nano mechanical machining, there are also some challenges with this technique, since the scale is reduced, such as size effects, burr formations, chip adhesions, fragility of tools and tool wear. Moreover, AFM based machining does not have any rotational movement, which makes fabrication of 3D features more difficult. Thus, vibration-assisted machining is introduced into AFM probe based nano mechanical machining to overcome the limitations associated with the conventional AFM probe based scratching method. Vibration-assisted machining reduced the cutting forces

  13. 2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING 168 (1960 HOG KILL) IS BENEATH HOG RUN - Rath Packing Company, Cantilevered Hog Run, Sycamore Street between Elm & Eighteenth Streets, Waterloo, Black Hawk County, IA

  14. Conductive probe AFM measurements of conjugated molecular wires.

    PubMed

    Ishida, Takao; Mizutani, Wataru; Liang, Tien-Tzu; Azehara, Hiroaki; Miyake, Koji; Sasaki, Shinya; Tokumoto, Hiroshi

    2003-12-01

    The electrical conduction of self-assembled monolayers (SAMs) made from conjugated molecules was measured using conductive probe atomic force microscopy (CP-AFM), with a focus on the molecular structural effect on conduction. First, the electrical conduction of SAMs made from phenylene oligomer SAMs was measured. The resistances through the monolayers increased exponentially with an increase in molecular length and the decay constants of transconductance beta were about 0.45 to 0.61 A(-1) measured at lower bias region. We further investigated the influence of applied load on the resistances. The resistances through terphenyl SAMs increased with an increase in the applied load up to 14 nN. Second, using an insertion technique into insulating alkanethiol SAMs, the electrical conduction of single conjugated terphenyl methanethiol and oligo(para-phenylenevinylene) (OPV) molecules embedded into insulating alkanethiol SAMs were measured. Electrical currents through these single molecules of OPVs were estimated to be larger than those through single terphenyl molecules, suggesting that the OPV structure can increase the electrical conduction of single molecules. Third, apparent negative differential resistance (NDR) was observed at higher bias measurements of SAMs. The appearance of NDR might be related to roughness of SAM surface, because apparent NDR was often observed on rough surfaces. In any case, the tip-molecule contact condition strongly affected carrier transport through metal tip/SAM/metal junction.

  15. Cantilever piezoelectric energy harvester with multiple cavities

    NASA Astrophysics Data System (ADS)

    Srinivasulu Raju, S.; Umapathy, M.; Uma, G.

    2015-11-01

    Energy harvesting employing piezoelectric materials in mechanical structures such as cantilever beams, plates, diaphragms, etc, has been an emerging area of research in recent years. The research in this area is also focused on structural tailoring to improve the harvested power from the energy harvesters. Towards this aim, this paper presents a method for improving the harvested power from a cantilever piezoelectric energy harvester by introducing multiple rectangular cavities. A generalized model for a piezoelectric energy harvester with multiple rectangular cavities at a single section and two sections is developed. A method is suggested to optimize the thickness of the cavities and the number of cavities required to generate a higher output voltage for a given cantilever beam structure. The performance of the optimized energy harvesters is evaluated analytically and through experimentation. The simulation and experimental results show that the performance of the energy harvester can be increased with multiple cavities compared to the harvester with a single cavity.

  16. Prom Health and Safety Tips

    MedlinePlus

    ... Healthy Occasions Autumn Tips Camping Tips Family Reunions Gardening Tips Halloween Tips Healthy Halloween Prom Tips Spring ... ways to stay active, such as walking, dancing, gardening, swimming, and more. Be active for 60 minutes ...

  17. Physics-based signal processing algorithms for micromachined cantilever arrays

    DOEpatents

    Candy, James V; Clague, David S; Lee, Christopher L; Rudd, Robert E; Burnham, Alan K; Tringe, Joseph W

    2013-11-19

    A method of using physics-based signal processing algorithms for micromachined cantilever arrays. The methods utilize deflection of a micromachined cantilever that represents the chemical, biological, or physical element being detected. One embodiment of the method comprises the steps of modeling the deflection of the micromachined cantilever producing a deflection model, sensing the deflection of the micromachined cantilever and producing a signal representing the deflection, and comparing the signal representing the deflection with the deflection model.

  18. Piezoelectric cantilevers energy harvesting in MEMS technique

    NASA Astrophysics Data System (ADS)

    Shang, Yingqi; Qiu, Chengjun; Liu, Hongmei; Chen, Xiaojie; Qu, Wei; Dou, Yanwei

    2011-11-01

    Piezoelectric cantilevers energy harvesting made by micro-electromechanical system (MEMS) technology can scavenge power from low-level ambient vibration sources. The developed cantilevers energy harvesting are featured with resonate frequency and power output in microwatt level, which is sufficient to the self-supportive sensors for in-service integrity monitoring of large social and environmental infrastructures at remote locations. In this paper, piezoelectric energy harvesting based on thick-film piezoelectric cantilevers is investigated to resonate at specific frequencies of an external vibration energy source, which creating electrical energy via the piezoelectric effect. Our cantilever device has a multiple structure with a proof mass added to the end. The thick film lead zirconate titanate Pb(Zr,Ti)O3 (PZT) coated on the top of Au/Cr/SiO2/Si substrates by sol-gel-spin method. The thickness of the PZT membrane was up to 2μm and the cantilevers substrates thickness 50μm, wideness 1.5mm, length 4mm. The Au/Ti top electrode is patterned on top of the sol-gel-spin coated PZT thick film in order to employ the d31 mode. The prototype energy generator has a measured performance of 0.74μW effective electrical power, and 4.93 DC output voltages to resistance load. The effect of proof mass, beam shape and damping on the power generating performance are modeled to provide a design guideline for maximum power harvesting from environmentally available low frequency vibrations. A multiple structure cantilever is designed to achieve compactness, low resonant frequency and minimum damping coefficient, simultaneously. This device is promising to support networks of ultra-low-power sensor.

  19. Piezoelectric cantilevers energy harvesting in MEMS technique

    NASA Astrophysics Data System (ADS)

    Shang, Yingqi; Qiu, Chengjun; Liu, Hongmei; Chen, Xiaojie; Qu, Wei; Dou, Yanwei

    2012-04-01

    Piezoelectric cantilevers energy harvesting made by micro-electromechanical system (MEMS) technology can scavenge power from low-level ambient vibration sources. The developed cantilevers energy harvesting are featured with resonate frequency and power output in microwatt level, which is sufficient to the self-supportive sensors for in-service integrity monitoring of large social and environmental infrastructures at remote locations. In this paper, piezoelectric energy harvesting based on thick-film piezoelectric cantilevers is investigated to resonate at specific frequencies of an external vibration energy source, which creating electrical energy via the piezoelectric effect. Our cantilever device has a multiple structure with a proof mass added to the end. The thick film lead zirconate titanate Pb(Zr,Ti)O3 (PZT) coated on the top of Au/Cr/SiO2/Si substrates by sol-gel-spin method. The thickness of the PZT membrane was up to 2μm and the cantilevers substrates thickness 50μm, wideness 1.5mm, length 4mm. The Au/Ti top electrode is patterned on top of the sol-gel-spin coated PZT thick film in order to employ the d31 mode. The prototype energy generator has a measured performance of 0.74μW effective electrical power, and 4.93 DC output voltages to resistance load. The effect of proof mass, beam shape and damping on the power generating performance are modeled to provide a design guideline for maximum power harvesting from environmentally available low frequency vibrations. A multiple structure cantilever is designed to achieve compactness, low resonant frequency and minimum damping coefficient, simultaneously. This device is promising to support networks of ultra-low-power sensor.

  20. Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM

    NASA Astrophysics Data System (ADS)

    Zandiatashbar, Ardavan; Taylor, Patrick A.; Kim, Byong; Yoo, Young-kook; Lee, Keibock; Jo, Ahjin; Lee, Ju Suk; Cho, Sang-Joon; Park, Sang-il

    2016-03-01

    Single crystal silicon wafers are the fundamental elements of semiconductor manufacturing industry. The wafers produced by Czochralski (CZ) process are very high quality single crystalline materials with known defects that are formed during the crystal growth or modified by further processing. While defects can be unfavorable for yield for some manufactured electrical devices, a group of defects like oxide precipitates can have both positive and negative impacts on the final device. The spatial distribution of these defects may be found by scattering techniques. However, due to limitations of scattering (i.e. light wavelength), many crystal defects are either poorly classified or not detected. Therefore a high throughput and accurate characterization of their shape and dimension is essential for reviewing the defects and proper classification. While scanning electron microscopy (SEM) can provide high resolution twodimensional images, atomic force microscopy (AFM) is essential for obtaining three-dimensional information of the defects of interest (DOI) as it is known to provide the highest vertical resolution among all techniques [1]. However AFM's low throughput, limited tip life, and laborious efforts for locating the DOI have been the limitations of this technique for defect review for 300 mm wafers. To address these limitations of AFM, automatic defect review AFM has been introduced recently [2], and is utilized in this work for studying DOI on 300 mm silicon wafer. In this work, we carefully etched a 300 mm silicon wafer with a gaseous acid in a reducing atmosphere at a temperature and for a sufficient duration to decorate and grow the crystal defects to a size capable of being detected as light scattering defects [3]. The etched defects form a shallow structure and their distribution and relative size are inspected by laser light scattering (LLS). However, several groups of defects couldn't be properly sized by the LLS due to the very shallow depth and low

  1. Self-heating in piezoresistive cantilevers

    PubMed Central

    Doll, Joseph C.; Corbin, Elise A.; King, William P.; Pruitt, Beth L.

    2011-01-01

    We report experiments and models of self-heating in piezoresistive microcantilevers that show how cantilever measurement resolution depends on the thermal properties of the surrounding fluid. The predicted cantilever temperature rise from a finite difference model is compared with detailed temperature measurements on fabricated devices. Increasing the fluid thermal conductivity allows for lower temperature operation for a given power dissipation, leading to lower force and displacement noise. The force noise in air is 76% greater than in water for the same increase in piezoresistor temperature. PMID:21731884

  2. Thermoelastic Analysis of a Vibrating TiB/Ti Cantilever Beam Using Differential Thermography

    SciTech Connect

    Byrd, Larry; Wyen, Travis; Byrd, Alex

    2008-02-15

    Differential thermography has been used to detect the fluctuating temperatures due the thermoelastic effect for a number of years. This paper examines functionally graded TiB/Ti cantilever beams excited on an electromechanical shaker in fully reversed bending. Finite difference analysis of specimens was used to look at the effect of heat conduction, convection and the fundamental frequency on the surface temperature distribution and compared to experimental data. The thermoelastic effect was also used to detect cracking and the stress field at the tip of the fixture during fatigue.

  3. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

    SciTech Connect

    Sader, John E.; Friend, James R.

    2015-05-15

    Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

  4. Fully three dimensional calculations of c-AFM current flow patterns, including space charge effects, traps and fibrous morphologies

    NASA Astrophysics Data System (ADS)

    Pimcharoen, Kanokkorn; Duxbury, Phillip

    2015-03-01

    Organic semiconductors are promising materials for many optoelectronic devices due to their versatile applications and low-cost fabrication, including organic photovoltaics (OPV), light-emitting diodes (OLED), and thin-film transistors (OTFT). The performance of these devices are controlled by charge transport which primarily depends on the nanoscale morphology. Unlike other microscopies, conductive Atomic Force Microscope (c-AFM) is capable of characterizing both nanoscale morphology and local electronic properties simultaneously. With this unique ability, c-AFM has been used extensively to characterized these organic semiconductor devices in the past decade, however the spreading of current from the tip geometry in the presence of traps, which are ubiquitous in these materials, is not well understood. We have developed a fully three dimensional device simulation tool enabling treatment of inhomogeneous systems including c-AFM tip geometry, spatially varying trap distributions, and fibrous morphologies. Results characterizing charge transport in the fibrous morphologies and in the presence of traps will be discussed, including the effect of traps and space charge effects on current spreading from the c-AFM tip.

  5. Hydration states of AFm cement phases

    SciTech Connect

    Baquerizo, Luis G.; Matschei, Thomas; Scrivener, Karen L.; Saeidpour, Mahsa; Wadsö, Lars

    2015-07-15

    The AFm phase, one of the main products formed during the hydration of Portland and calcium aluminate cement based systems, belongs to the layered double hydrate (LDH) family having positively charged layers and water plus charge-balancing anions in the interlayer. It is known that these phases present different hydration states (i.e. varying water content) depending on the relative humidity (RH), temperature and anion type, which might be linked to volume changes (swelling and shrinkage). Unfortunately the stability conditions of these phases are insufficiently reported. This paper presents novel experimental results on the different hydration states of the most important AFm phases: monocarboaluminate, hemicarboaluminate, strätlingite, hydroxy-AFm and monosulfoaluminate, and the thermodynamic properties associated with changes in their water content during absorption/desorption. This data opens the possibility to model the response of cementitious systems during drying and wetting and to engineer systems more resistant to harsh external conditions.

  6. Biomechanical load analysis of cantilevered implant systems.

    PubMed

    Osier, J F

    1991-01-01

    Historically, dental implants have been placed in areas where quality bone exists. The maxillary sinus areas and mandibular canal proximities have been avoided. From these placements, various cantilevered prosthetic applications have emerged. This analysis uses static engineering principles to define the loads (i.e., forces) placed upon the implants. These principles make use of Newton's first and third laws of mechanics by summing the forces and moments to zero. These summations then generate mathematical equations and their algebraic solutions. Three implant systems are analyzed. The first is a two-implant system. The second is a three-implant cross-arch stabilized system usually found in mandibular replacements of lower full dentures. The third is a five-implant system which is identical to the three-implant cantilevered system but which uses implants in the first molar area, thereby negating the cantilevered load magnification of the three-implant design. These analyses demonstrate that, in a cantilevered application, the implant closest to the point of load application (usually the most posterior implant) takes the largest compressive load. Implants opposite the load application (generally the anterior implant) are in tension. These loads on the implants are normally magnified over the biting force and can easily reach 2 1/2 to five times the biting load.

  7. Forced Vibrations of a Cantilever Beam

    ERIC Educational Resources Information Center

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-01-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is "downwards", i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping…

  8. Direct and alignment-insensitive measurement of cantilever curvature

    SciTech Connect

    Hermans, Rodolfo I.; Aeppli, Gabriel; Bailey, Joe M.

    2013-07-15

    We analytically derive and experimentally demonstrate a method for the simultaneous measurement of deflection for large arrays of cantilevers. The Fresnel diffraction patterns of a cantilever independently reveal tilt, curvature, cubic, and higher order bending of the cantilever. It provides a calibrated absolute measurement of the polynomial coefficients describing the cantilever shape, without careful alignment and could be applied to several cantilevers simultaneously with no added complexity. We show that the method is easily implemented, works in both liquid media and in air, for a broad range of displacements and is especially suited to the requirements for multi-marker biosensors.

  9. Atomic-scale sharpening of silicon tips in noncontact atomic force microscopy.

    PubMed

    Caciuc, V; Hölscher, H; Blügel, S; Fuchs, H

    2006-01-13

    The atomic-scale stability of clean silicon tips used in noncontact atomic force microscopy (NC-AFM) is simulated by ab initio calculations based on density functional theory. The tip structures are modeled by silicon clusters with and termination. For the often assumed Si(111)-type tip we observe the sharpening of the initially blunt tip via short-range chemical forces during the first approach and retraction cycle. The structural changes corresponding to this intrinsic process are irreversible and lead to stable NC-AFM imaging conditions. In opposition to the picture used in literature, the Si(001)-type tip does not exhibit the so-called "two-dangling bond" feature as a bulklike termination suggests.

  10. Simultaneous topographic and amperometric membrane mapping using an AFM probe integrated biosensor.

    PubMed

    Stanca, Sarmiza Elena; Csaki, Andrea; Urban, Matthias; Nietzsche, Sandor; Biskup, Christoph; Fritzsche, Wolfgang

    2011-02-15

    The investigation of the plasma membrane with intercorrelated multiparameter techniques is a prerequisite for understanding its function. Presented here, is a simultaneous electrochemical and topographic study of the cell membrane using a miniaturized amperometric enzymatic biosensor. The fabrication of this biosensor is also reported. The biosensor combines a scanning force microscopy (AFM) gold-coated cantilever and an enzymatic transducer layer of peroxidases (PODs). When these enzymes are brought in contact with the substrate, the specific redox reaction produces an electric current. The intensity of this current is detected simultaneously with the surface imaging. For sensor characterization, hydroquinone-2-carboxylic acid (HQ) is selected as an intrinsic source of H(2)O(2). HQ has been electrochemically regenerated by the reduction of antraquinone-2-carboxylic acid (AQ). The biosensor reaches the steady state value of the current intensity in 1 ± 0.2s.

  11. New AFM Techniques for Investigating Molecular Growth Mechanisms of Protein Crystals

    NASA Technical Reports Server (NTRS)

    Li, Huayu; Nadarajah, Arunan; Konnert, John H.; Pusey, Marc L.

    1998-01-01

    Atomic Force Microscopy (AFM) has emerged as a powerful technique for investigating protein crystal growth. Earlier AFM studies were among the first to demonstrate that these crystals grew by dislocation and 2D nucleation growth mechanisms [1]. These investigations were restricted to the micron range where only surface features, such as dislocation hillocks and 2D islands are visible. Most AFM instruments can scan at higher resolutions and have the potential to resolve individual protein molecules at nanometer ranges. Such scans are essential for determining the molecular packing arrangements on crystal faces and for probing the growth process at the molecular level. However, at this resolution the AFM tip influences the image produced, with the resulting image being a convolution of the tip shape and the surface morphology [2]. In most studies this problem is resolved by deconvoluting the image to obtain the true surface morphology. Although deconvolution routines work reasonably well for simple one- dimensional shapes, for complex surfaces this approach does not produce accurate results. In this study we devised a new approach which takes advantage of the precise molecular order of crystal surfaces, combined with the knowledge of individual molecular shapes from the crystallographic data of the protein and the AFM tip shape. This information is used to construct expected theoretical AFM images by convoluting the tip shape with the constructed crystal surface shape for a given surface packing arrangement. By comparing the images from actual AFM scans with the constructed ones for different possible surface packing arrangements, the correct packing arrangement can be conclusively determined. This approach was used in this study to determine the correct one from two possible packing arrangements on (I 10) faces of tetragonal lysozyme crystals. Another novel AFM technique was also devised to measure the dimension of individual growth units of the crystal faces

  12. Tip Based Nanofabrication Using Multi-mode Scanning Probe Microscopy

    NASA Astrophysics Data System (ADS)

    Hu, Weihua

    Scanning probe microscopy (SPM) based nanotechnology is a promising technology in nano-device fabrication. It is able to both manipulate nanostructures and characterize the created nanopatterns using the nano-tip of the scanning probe on a mechanical basis or electrical basis. With the tip and device on similar scales, nano-tip based fabrication permits accurate control over the device geometry through tip manipulation with nanometer (or better) accuracy. However, SPM based nanofabrication is a slow process because the scanning velocity of the microscopy is low. Large, multi-tip arrays offer the possibility for parallel device fabrication, allowing mass fabrication with nanometer control. The goal of Tip-directed Field-emission Assisted Nanofabrication (TFAN) project was to realize parallel fabrication using our probe arrays. We started by fabricating nanodevice using one single probe. In this work, we investigated the study of fabricating single electron transistor (SET) using one single SPM probe. There were four stages we went through toward fabricating a SET. The first stage was to accomplish atomic-precision lithography in TFAN system. Atomic level lithography was achieved by desorbing hydrogen atoms, which were previously adsorbed to the Si(100)-2 × 1 surface, in ultrahigh vacuum scanning tunneling microscopy (UHV-STM). The second stage was to develop method for fabricating SET. SPM based local oxidation was chosen as the method to fabricate a SET on a thin titanium (Ti) film. A multi-mode SPM oxidation method was developed, in which both scanning tunneling microscopy (STM) mode and atomic microscopy (AFM) mode local oxidation were used to fabricated Ti-TiOx-Ti structures with the same conductive AFM probe. This multi-mode method enabled significantly fine feature size control by STM mode, working on insulating SiO2 substrates needed to isolate the device by AFM mode and in situ electrical characterization with conductive AFM mode. After developing the multi

  13. Application of a passive/active autoparametric cantilever beam absorber with PZT actuator for Duffing systems

    NASA Astrophysics Data System (ADS)

    Silva-Navarro, G.; Abundis-Fong, H. F.; Vazquez-Gonzalez, B.

    2013-04-01

    An experimental investigation is carried out on a cantilever-type passive/active autoparametric vibration absorber, with a PZT patch actuator, to be used in a primary damped Duffing system. The primary system consists of a mass, viscous damping and a cubic stiffness provided by a soft helical spring, over which is mounted a cantilever beam with a PZT patch actuator actively controlled to attenuate harmonic and resonant excitation forces. With the PZT actuator on the cantilever beam absorber, cemented to the base of the beam, the auto-parametric vibration absorber is made active, thus enabling the possibility to control the effective stiffness and damping associated to the passive absorber and, as a consequence, the implementation of an active vibration control scheme able to preserve, as possible, the autoparametric interaction as well as to compensate varying excitation frequencies and parametric uncertainty. This active vibration absorber employs feedback information from a high resolution optical encoder on the primary Duffing system and an accelerometer on the tip beam absorber, a strain gage on the base of the beam, feedforward information from the excitation force and on-line computations from the nonlinear approximate frequency response, parameterized in terms of a proportional gain provided by a voltage input to the PZT actuator, thus modifying the closed-loop dynamic stiffness and providing a mechanism to asymptotically track an optimal, robust and stable attenuation solution on the primary Duffing system. Experimental results are included to describe the dynamic and robust performance of the overall closed-loop system.

  14. Computational local stiffness analysis of biological cell: High aspect ratio single wall carbon nanotube tip.

    PubMed

    TermehYousefi, Amin; Bagheri, Samira; Shahnazar, Sheida; Rahman, Md Habibur; Kadri, Nahrizul Adib

    2016-02-01

    Carbon nanotubes (CNTs) are potentially ideal tips for atomic force microscopy (AFM) due to the robust mechanical properties, nanoscale diameter and also their ability to be functionalized by chemical and biological components at the tip ends. This contribution develops the idea of using CNTs as an AFM tip in computational analysis of the biological cells. The proposed software was ABAQUS 6.13 CAE/CEL provided by Dassault Systems, which is a powerful finite element (FE) tool to perform the numerical analysis and visualize the interactions between proposed tip and membrane of the cell. Finite element analysis employed for each section and displacement of the nodes located in the contact area was monitored by using an output database (ODB). Mooney-Rivlin hyperelastic model of the cell allows the simulation to obtain a new method for estimating the stiffness and spring constant of the cell. Stress and strain curve indicates the yield stress point which defines as a vertical stress and plan stress. Spring constant of the cell and the local stiffness was measured as well as the applied force of CNT-AFM tip on the contact area of the cell. This reliable integration of CNT-AFM tip process provides a new class of high performance nanoprobes for single biological cell analysis. PMID:26652417

  15. Diet and Exercise Tips

    MedlinePlus

    ... Health News & Publications Annual Meeting Calendar Diet and Exercise Tips Diet and Exercise Tips News media interested in covering the latest ... Health Statistics concludes that 35 percent of adults exercise regularly (more than 6 of 10 don’t), ...

  16. Analytical solutions to the free vibration of a double-walled carbon nanotube carrying a bacterium at its tip

    SciTech Connect

    Storch, Joel A.; Elishakoff, Isaac

    2013-11-07

    We calculate the natural frequencies and mode shapes of a cantilevered double-walled carbon nanotube carrying a rigid body—representative of a bacterium or virus—at the tip of the outer nanotube. By idealizing the nanotubes as Bernoulli-Euler beams, we are able to obtain exact expressions for both the mode shapes and characteristic frequency equation. Separate analyses are performed for the special case of a concentrated tip mass and the more complicated situation where the tip body also exhibits inertia and mass center offset from the beam tip.

  17. Implications of the contact radius to line step (CRLS) ratio in AFM for nanotribology measurements.

    PubMed

    Helt, James M; Batteas, James D

    2006-07-01

    Investigating the mechanisms of defect generation and growth at surfaces on the nanometer scale typically requires high-resolution tools such as the atomic force microscope (AFM). To accurately assess the kinetics and activation parameters of defect production over a wide range of loads (F(z)), the AFM data should be properly conditioned. Generally, AFM wear trials are performed over an area defined by the length of the slow (L(sscan)) and fast scan axes. The ratio of L(sscan) to image resolution (res, lines per image) becomes an important experimental parameter in AFM wear trials because it defines the magnitude of the line step (LS = L(sscan)/res), the distance the AFM tip steps along the slow scan axis. Comparing the contact radius (a) to the line step (LS) indicates that the overlap of successive scans will result unless the contact radius-line step ratio (CRLS) is < or =(1)/(2). If this relationship is not considered, then the scan history (e.g., contact frequency) associated with a single scan is not equivalent at different loads owing to the scaling of contact radius with load (a proportional variant F(z)(1/3)). Here, we present a model in conjunction with empirical wear tests on muscovite mica to evaluate the effects of scan overlap on surface wear. Using the Hertz contact mechanics definition of a, the CRLS model shows that scan overlap pervades AFM wear trials even under low loads. Such findings indicate that simply counting the number of scans (N(scans)) in an experiment underestimates the full history conveyed to the surface by the tip and translates into an error in the actual extent to which a region on the surface is contacted. Utilizing the CRLS method described here provides an approach to account for image scan history accurately and to predict the extent of surface wear. This general model also has implications for any AFM measurement where one wishes to correlate scan-dependent history to image properties as well as feature resolution in scanned

  18. Implications of the contact radius to line step (CRLS) ratio in AFM for nanotribology measurements.

    PubMed

    Helt, James M; Batteas, James D

    2006-07-01

    Investigating the mechanisms of defect generation and growth at surfaces on the nanometer scale typically requires high-resolution tools such as the atomic force microscope (AFM). To accurately assess the kinetics and activation parameters of defect production over a wide range of loads (F(z)), the AFM data should be properly conditioned. Generally, AFM wear trials are performed over an area defined by the length of the slow (L(sscan)) and fast scan axes. The ratio of L(sscan) to image resolution (res, lines per image) becomes an important experimental parameter in AFM wear trials because it defines the magnitude of the line step (LS = L(sscan)/res), the distance the AFM tip steps along the slow scan axis. Comparing the contact radius (a) to the line step (LS) indicates that the overlap of successive scans will result unless the contact radius-line step ratio (CRLS) is < or =(1)/(2). If this relationship is not considered, then the scan history (e.g., contact frequency) associated with a single scan is not equivalent at different loads owing to the scaling of contact radius with load (a proportional variant F(z)(1/3)). Here, we present a model in conjunction with empirical wear tests on muscovite mica to evaluate the effects of scan overlap on surface wear. Using the Hertz contact mechanics definition of a, the CRLS model shows that scan overlap pervades AFM wear trials even under low loads. Such findings indicate that simply counting the number of scans (N(scans)) in an experiment underestimates the full history conveyed to the surface by the tip and translates into an error in the actual extent to which a region on the surface is contacted. Utilizing the CRLS method described here provides an approach to account for image scan history accurately and to predict the extent of surface wear. This general model also has implications for any AFM measurement where one wishes to correlate scan-dependent history to image properties as well as feature resolution in scanned

  19. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system

    NASA Astrophysics Data System (ADS)

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-01

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films.

  20. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system.

    PubMed

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-10

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films. PMID:27146083

  1. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system.

    PubMed

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-10

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films.

  2. Contact nanomechanical measurements with the AFM

    NASA Astrophysics Data System (ADS)

    Geisse, Nicholas

    2013-03-01

    The atomic force microscope (AFM) has found broad use in the biological sciences largely due to its ability to make measurements on unfixed and unstained samples under liquid. In addition to imaging at multiple spatial scales ranging from micro- to nanometer, AFMs are commonly used as nanomechanical probes. This is pertinent for cell biology, as it has been demonstrated that the geometrical and mechanical properties of the extracellular microenvironment are important in such processes as cancer, cardiovascular disease, muscular dystrophy, and even the control of cell life and death. Indeed, the ability to control and quantify these external geometrical and mechanical parameters arises as a key issue in the field. Because AFM can quantitatively measure the mechanical properties of various biological samples, novel insights to cell function and to cell-substrate interactions are now possible. As the application of AFM to these types of problems is widened, it is important to understand the performance envelope of the technique and its associated data analyses. This talk will discuss the important issues that must be considered when mechanical models are applied to real-world data. Examples of the effect of different model assumptions on our understanding of the measured material properties will be shown. Furthermore, specific examples of the importance of mechanical stimuli and the micromechanical environment to the structure and function of biological materials will be presented.

  3. Child Transportation Safety Tips.

    ERIC Educational Resources Information Center

    National Highway Traffic Safety Administration (DOT), Washington, DC.

    This document presents nine tips regarding safe infant and child transportation, each tip explained in one to two pages. The tips are as follows: (1) quick safety seat checkup; (2) where should your child ride? (3) how to protect your new baby in the car; (4) what safety seat to use for a big baby or toddler? (5) how should preschool and school…

  4. Fracture Mechanics Testing of Titanium 6AL-4V in AF-M315E

    NASA Technical Reports Server (NTRS)

    Sampson, J. W.; Martinez, J.; McLean, C.

    2016-01-01

    The Green Propellant Infusion Mission (GPIM) will demonstrate the performance of AF-M315E monopropellant on orbit. Flight certification requires a safe-life analysis of the titanium alloy fuel tank to ensure inherent processing flaws will not cause failure during the design life of the tank. Material property inputs for this analysis require testing to determine the stress intensity factor for environment-assisted cracking (KEAC) of Ti 6Al-4V in combination with the AF-M315E monopropellant. Testing of single-edge notched, or SE(B), specimens representing the bulk tank membrane and weld material were performed in accordance with ASTM E1681. Specimens with fatigue pre-cracks were loaded into test fixtures so that the crack tips were exposed to AF-M315E at 50 C for a duration of 1,000 hours. Specimens that did not fail during exposure were opened to inspect the crack surfaces for evidence of crack growth. The threshold stress intensity value, KEAC, is the highest applied stress intensity that produced neither a failure of the specimen during the exposure nor showed evidence of crack growth. The threshold stress intensity factor for environment-assisted cracking of the Ti 6Al-4V forged tank material was found to be at least 22 ksivin and at least 31 ksivin for the weld material when exposed to AF-M315E monopropellant.

  5. Difference in cellular mechanics of cancer and normal cervical cells as seen with the AFM

    NASA Astrophysics Data System (ADS)

    Sokolov, Igor; Iyer, Swaminathan; Subba-Rao, Venkatesh; Woodworth, Craig

    2006-03-01

    Oncogenically transformed cells differ from their normal counter parts in many aspects, including organization and the amount of cytoskeleton. Consequently it is natural to expect to see the difference in cellular mechanics. Here we will present the study of such differences by using atomic force microscopy (AFM) in-vitro. So far the present research is the first study of mechanics of cervical cells, and the third comparative study of differences between mechanics of cancer and normal cells down with the help of AFM. Using a micron size silica ball as the AFM probe, we presumably do not overstress the cell surface as it can be in the case of the sharp AFM tip, and consequently, we may use the classical Hertz model. In contrast to the reported previously studies (bladder and fibroblast cells), we found that oncogenically transformed cervical cells are more rigid than the normal cells. The reason for such difference will be discussed. To demonstrate the complexity of the problem, we study cell mechanics in detail. The Young's modulus of rigidity clearly shows two separate regions of rigidity depending on the depth of the probe penetration. There may be two alternative explanations of the difference in rigidity of this top layer: it is either the cell membrane layer or detected long-range (presumably steric) forces due to the molecular ``brush'' of glycocalyx molecules. Experiments and modal calculations will be presented to choose between these two possibilities.

  6. Micromachined silicon cantilever beam accelerometer incorporating an integrated optical waveguide

    NASA Technical Reports Server (NTRS)

    Burcham, Kevin E.; De Brabander, Gregory N.; Boyd, Joseph T.

    1993-01-01

    A micromachined cantilever beam accelerometer is described in which beam deflection is determined optically. A diving board structure is anisotropically etched into a silicon wafer. This diving board structure is patterned from the wafer backside so as to leave a small gap between the tip of the diving board and the opposite fixed edge on the front side of the wafer. In order to sense a realistic range of accelerations, a foot mass incorporated onto the end of the beam is found to provide design flexibility. A silicon nitride optical waveguide is then deposited by low pressure chemical vapor deposition (LPCVD) onto the sample. Beam deflection is measured by the decrease of light coupled across the gap between the waveguide sections. In order to investigate sensor response and simulate deflection of the beam, we utilized a separate beam and waveguide section which could be displaced from one another in a precisely controlled manner. Measurements were performed on samples with gaps of 4.0, 6.0, and 8.0 micron and the variation of the fraction of light coupled across the gap as a function of displacement and gap spacing was found to agree with overlap integral calculations.

  7. A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy.

    PubMed

    Santos, Sergio; Guang, Li; Souier, Tewfik; Gadelrab, Karim; Chiesa, Matteo; Thomson, Neil H

    2012-04-01

    We provide a method to characterize the tip radius of an atomic force microscopy in situ by monitoring the dynamics of the cantilever in ambient conditions. The key concept is that the value of free amplitude for which transitions from the attractive to repulsive force regimes are observed, strongly depends on the curvature of the tip. In practice, the smaller the value of free amplitude required to observe a transition, the sharper the tip. This general behavior is remarkably independent of the properties of the sample and cantilever characteristics and shows the strong dependence of the transitions on the tip radius. The main advantage of this method is rapid in situ characterization. Rapid in situ characterization enables one to continuously monitor the tip size during experiments. Further, we show how to reproducibly shape the tip from a given initial size to any chosen larger size. This approach combined with the in situ tip size monitoring enables quantitative comparison of materials measurements between samples. These methods are set to allow quantitative data acquisition and make direct data comparison readily available in the community.

  8. Functionalization of atomic force microscope tips by dielectrophoretic assembly of Gd(2)O(3):Eu(3+) nanorods.

    PubMed

    Macedo, Andreia G; Ananias, Duarte; André, Paulo S; Sá Ferreira, Rute A; Kholkin, Andrei L; Carlos, Luís D; Rocha, J

    2008-07-23

    An atomic force microscopy (AFM) tip has been coated with photoluminescent Eu(3+)-doped Gd(2)O(3) nanorods using a dielectrophoresis technique, which preserves the red emission of the nanorods (quantum yield 0.47). The performance of the modified tips has been tested by using them for regular topography imaging in tapping and contact modes. Both a regular AFM standard grid and a patterned surface (of an organic-inorganic methacrylate Zr-based oxo-cluster and poly(oxyethylene)/siloxane hybrid) have been used. Similar depth values have been measured using a conventional silicon tip and the nanorod-modified tip. The tips before and after use exhibit similar SEM images and photoluminescence spectra and, thus, seem to be stable under working conditions. These tips should find applications in scanning near-field optical microscopy and other scanning techniques.

  9. Lead-Free Piezoelectric MEMS Energy Harvesters of (K,Na)NbO3 Thin Films on Stainless Steel Cantilevers

    NASA Astrophysics Data System (ADS)

    Tsujiura, Yuichi; Suwa, Eisaku; Kurokawa, Fumiya; Hida, Hirotaka; Suenaga, Kazufumi; Shibata, Kenji; Kanno, Isaku

    2013-09-01

    We fabricated piezoelectric MEMS energy harvesters (EHs) of lead-free (K,Na)NbO3 (KNN) thin films on microfabricated stainless steel cantilevers. The use of metal substrates makes it possible to fabricate thin cantilevers owing to a large fracture toughness compared with Si substrates. KNN films were directly deposited onto Pt-coated stainless steel cantilevers by rf-magnetron sputtering, thereby simplifying the fabrication process of the EHs. From XRD measurement, we confirmed that the KNN films on Pt-coated stainless steel cantilevers had a perovskite structure with a preferential (001) orientation. The transverse piezoelectric coefficient e31f and relative dielectric constant ɛr were measured to be -3.8 C/m2 and 409, respectively. From the evaluation of the power generation performance of a KNN thin-film EH (length: 7.5 mm, width: 5.0 mm, weight of tip mass: 25 mg), we obtained a large average output power of 1.6 µW under vibration at 393 Hz and 10 m/s2.

  10. Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor.

    PubMed

    Stirling, Julian; Shaw, Gordon A

    2013-01-01

    In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

  11. Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

    PubMed Central

    Shaw, Gordon A

    2013-01-01

    Summary In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements. PMID:23400392

  12. Arctic climate tipping points.

    PubMed

    Lenton, Timothy M

    2012-02-01

    There is widespread concern that anthropogenic global warming will trigger Arctic climate tipping points. The Arctic has a long history of natural, abrupt climate changes, which together with current observations and model projections, can help us to identify which parts of the Arctic climate system might pass future tipping points. Here the climate tipping points are defined, noting that not all of them involve bifurcations leading to irreversible change. Past abrupt climate changes in the Arctic are briefly reviewed. Then, the current behaviour of a range of Arctic systems is summarised. Looking ahead, a range of potential tipping phenomena are described. This leads to a revised and expanded list of potential Arctic climate tipping elements, whose likelihood is assessed, in terms of how much warming will be required to tip them. Finally, the available responses are considered, especially the prospects for avoiding Arctic climate tipping points.

  13. Determination of work of adhesion of biological cell under AFM bead indentation.

    PubMed

    Zhu, Xinyao; Siamantouras, E; Liu, K K; Liu, X

    2016-03-01

    Hertz contact theory has been widely used for the determination of cell elasticity based on AFM indentation experiments. In light of the adhesive contact between AFM tip and cell, this study applied Johnson-Kendall-Roberts (JKR) model to fit the indentation force-displacement (F-D) curves reported previously. A MIN6 cell has been modeled as first a sphere and then a flattened cell with different thicknesses. The results have shown that both basic JKR model and "generalized" JKR model can best describe the unloading force-displacement behaviors of the indentation curves. The Young׳s modulus of the cell and the work of adhesion of the cell-indenter interface are obtained. In comparison to the Hertzian contact model, the JKR model provides obviously better fitting to the experimental results, indicating that the adhesion is significant in the cell interaction. PMID:26688423

  14. High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.

    PubMed

    Onishi, Keiko; Guo, Hongxuan; Nagano, Syoko; Fujita, Daisuke

    2014-11-01

    A Scanning Helium Ion Microscope (SHIM) is a high resolution surface observation instrument similar to a Scanning Electron Microscope (SEM) since both instruments employ finely focused particle beams of ions or electrons [1]. The apparent difference is that SHIMs can be used not only for a sub-nanometer scale resolution microscopic research, but also for the applications of very fine fabrication and direct lithography of surfaces at the nanoscale dimensions. On the other hand, atomic force microscope (AFM) is another type of high resolution microscopy which can measure a three-dimensional surface morphology by tracing a fine probe with a sharp tip apex on a specimen's surface.In order to measure highly uneven and concavo-convex surfaces by AFM, the probe of a high aspect ratio with a sharp tip is much more necessary than the probe of a general quadrangular pyramid shape. In this paper we report the manufacture of the probe tip of the high aspect ratio by ion-beam induced gas deposition using a nanoscale helium ion beam of SHIM.Gas of platinum organic compound was injected into the sample surface neighborhood in the vacuum chamber of SHIM. The decomposition of the gas and the precipitation of the involved metal brought up a platinum nano-object in a pillar shape on the normal commercial AFM probe tip. A SHIM system (Carl Zeiss, Orion Plus) equipped with the gas injection system (OmniProbe, OmniGIS) was used for the research. While the vacuum being kept to work, we injected platinum organic compound ((CH3)3(CH3C5H4)Pt) into the sample neighborhood and irradiated the helium ion beam with the shape of a point on the apex of the AFM probe tip. It is found that we can control the length of the Pt nano-pillar by irradiation time of the helium ion beam. The AFM probe which brought up a Pt nano-pillar is shown in Figure 1. It is revealed that a high-aspect-ratio Pt nano-pillar of ∼40nm diameter and up to ∼2000 nm length can be grown. In addition, for possible heating

  15. Fabrication and characterization of microlens arrays using a cantilever-based spotter

    NASA Astrophysics Data System (ADS)

    Bardinal, V.; Daran, E.; Leïchlé, T.; Vergnenègre, C.; Levallois, C.; Camps, T.; Conedera, V.; Doucet, J. B.; Carcenac, F.; Ottevaere, H.; Thienpont, H.

    2007-05-01

    We present a quantitative study on the fabrication of microlenses using a low-cost polymer dispending technique. Our method is based on the use of a silicon micro-cantilever robotized spotter system. We first give a detailed description of the technique. In a second part, the fabricated microlenses are fully characterized by means of SEM (Scanning Electron Microscope), AFM (Atomic Force Microscopy) non contact optical profilometry and Mach-Zehnder interferometry. Diameters in the range [25-130μm] are obtained with an average surface roughness of 2.02nm. Curvature radii, focal lengths as well as aberrations are also measured for the first time: the fabricated microlenses present focal lengths in the range [55-181μm] and exhibit high optical quality only limited by diffraction behaviour with RMS aberration lower than λ/14.

  16. Inner Crack Detection Method for Cantilever Beams

    NASA Astrophysics Data System (ADS)

    Li, Zheng; Zhang, Wei; Li, Yixuan; Su, Xianyue

    2008-02-01

    In this paper, continuous wavelet transform has been performed to extract the inner crack information from the guided waves in cantilever beams, and the location and size of crack can be detected exactly. Considering its best time-frequency property, Gabor continuous wavelet transform is employed to analyze the complicated flexible wave signals in cantilever beam, which is inspirited by an impact on the free end. Otherwise, in order to enhance the sensitivity of detection for some small cracks, an improved method is discussed. Here, both computational and experimental methods are carried out for comparing the influence of different crack location in beam. Therefore, the method proposed can be expected to expand to a powerful damage detection method in a broad engineering application.

  17. Cantilever mounted resilient pad gas bearing

    NASA Technical Reports Server (NTRS)

    Etsion, I. (Inventor)

    1978-01-01

    A gas-lubricated bearing is described, employing at least one pad mounted on a rectangular cantilever beam to produce a lubricating wedge between the face of the pad and a moving surface. The load-carrying and stiffness characteristics of the pad are related to the dimensions and modulus of elasticity of the beam. The bearing is applicable to a wide variety of types of hydrodynamic bearings.

  18. The NTA-His6 bond is strong enough for AFM single-molecular recognition studies.

    PubMed

    Verbelen, Claire; Gruber, Hermann J; Dufrêne, Yves F

    2007-01-01

    There is a need in current atomic force microscopy (AFM) molecular recognition studies for generic methods for the stable, functional attachment of proteins on tips and solid supports. In the last few years, the site-directed nitrilotriacetic acid (NTA)-polyhistidine (Hisn) system has been increasingly used towards this goal. Yet, a crucial question in this context is whether the NTA-Hisn bond is sufficiently strong for ensuring stable protein immobilization during force spectroscopy measurements. Here, we measured the forces between AFM tips modified with NTA-terminated alkanethiols and solid supports functionalized with His6-Gly-Cys peptides in the presence of Ni2+. The force histogram obtained at a loading rate of 6600 pN s(-1) showed three maxima at rupture forces of 153 +/- 57 pN, 316 +/- 50 pN and 468 +/- 44 pN, that we attribute primarily to monovalent and multivalent interactions between a single His6 moiety and one, two and three NTA groups, respectively. The measured forces are well above the 50-100 pN unbinding forces typically observed by AFM for receptor-ligand pairs. The plot of adhesion force versus log (loading rate) revealed a linear regime, from which we deduced a kinetic off-rate constant of dissociation, k(off) approximately 0.07 s(-1). This value is in the range of that estimated for the multivalent interaction involving two NTA, using fluorescence measurements, and may account for an increased binding stability of the NTA-His6 bond. We conclude that the NTA-His6 system is a powerful, well-suited platform for the stable, oriented immobilization of proteins in AFM single-molecule studies. PMID:17712775

  19. Adaptive AFM scan speed control for high aspect ratio fast structure tracking

    SciTech Connect

    Ahmad, Ahmad; Schuh, Andreas; Rangelow, Ivo W.

    2014-10-15

    Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is necessary to cover a large surface under investigation in reasonable times. Since AFMs are composed of mechanical components, they are associated with comparably low resonance frequencies that undermine the effort to increase the acquisition rates. In particular, high and steep structures are difficult to follow, which causes the cantilever to temporarily loose contact to or crash into the sample. Here, we report on a novel approach that does not affect the scanner dynamics, but adapts the lateral scanning speed of the scanner. The controller monitors the control error signal and, only when necessary, decreases the scan speed to allow the z-piezo more time to react to changes in the sample's topography. In this case, the overall imaging rate can be significantly increased, because a general scan speed trade-off decision is not needed and smooth areas are scanned fast. In contrast to methods trying to increase the z-piezo bandwidth, our method is a comparably simple approach that can be easily adapted to standard systems.

  20. Fast image scanning method in liquid-AFM without image distortion.

    PubMed

    Choi, Inhee; Kim, Younghun; Kim, Jong Ho; Yang, Young In; Lee, Jeongjin; Lee, Suseung; Hong, Surin; Yi, Jongheop

    2008-11-01

    High speed imaging by atomic force microscopy (AFM) allows one to directly observe the dynamic behavior of a sample surface immersed in liquid media; thus, it has been considered to be an indispensable tool for nanobiotechnology and is used in many research fields, including molecular biology and surface science. For real-time observation of a certain behavior, the high speed imaging technique should be accompanied with a high resolution imaging technique to identify target materials. To improve the image quality at a high scanning rate, we developed a variable-controlled fast scanning method, which originated from the modified squeeze-drag superposition model in liquid media. A collection of non-distorted images was accomplished after proper modification of the operating conditions in a viscous fluid, via the simple handling of loading force and cantilever length. Consequently, a speeded-up AFM imaging process was achieved in the liquid environment at up to 200 µm s(-1), without attachment of additional devices. The reliability of the proposed method was verified by the characterization of a grating sample immersed in three types of liquid media. In addition, the results were visualized for elastic biomolecules submerged in a liquid with high kinematic viscosity. PMID:21832743

  1. Comparison of the Identation and Elasticity of E.coli and its Spheroplasts by AFM

    SciTech Connect

    Sullivan, Claretta J; Venkataraman, Sankar; Retterer, Scott T; Allison, David P; Doktycz, Mitchel John

    2007-01-01

    Atomic force microscopy (AFM) provides a unique opportunity to study live individual bacteria at the nanometer scale. In addition to providing accurate morphological information, AFM can be exploited to investigate membrane protein localization and molecular interactions on the surface of living cells. A prerequisite for these studies is the development of robust procedures for sample preparation. While such procedures are established for intact bacteria, they are only beginning to emerge for bacterial spheroplasts. Spheroplasts are useful research models for studying mechanosensitive ion channels, membrane transport, lipopolysaccharide translocation, solute uptake, and the effects of antimicrobial agents on membranes. Furthermore, given the similarities between spheroplasts and cell wall-deficient (CWD) forms of pathogenic bacteria, spheroplast research could be relevant in biomedical research. In this paper, a new technique for immobilizing spheroplasts on mica pretreated with aminopropyltriethoxysilane (APTES) and glutaraldehyde is described. Using this mounting technique, the indentation and cell elasticity of glutaraldehyde-fixed and untreated spheroplasts of E. coli in liquid were measured. These values are compared to those of intact E. coli. Untreated spheroplasts were found to be much softer than the intact cells and the silicon nitride cantilevers used in this study.

  2. Application of catalyst-free click reactions in attaching affinity molecules to tips of atomic force microscopy for detection of protein biomarkers.

    PubMed

    Senapati, Subhadip; Manna, Saikat; Lindsay, Stuart; Zhang, Peiming

    2013-11-26

    Atomic force microscopy (AFM) has been extensively used in studies of biological interactions. Particularly, AFM based force spectroscopy and recognition imaging can sense biomolecules on a single molecule level, having great potential to become a tool for molecular diagnostics in clinics. These techniques, however, require affinity molecules to be attached to AFM tips in order to specifically detect their targets. The attachment chemistry currently used on silicon tips involves multiple steps of reactions and moisture sensitive chemicals, such as (3-aminopropyl)triethoxysilane (APTES) and N-hydroxysuccinimide (NHS) ester, making the process difficult to operate in aqueous solutions. In the present study, we have developed a user-friendly protocol to functionalize the AFM tips with affinity molecules. A key feature of it is that all reactions are carried out in aqueous solutions. In summary, we first synthesized a molecular anchor composed of cyclooctyne and silatrane for introduction of a chemically reactive function to AFM tips and a bifunctional polyethylene glycol linker that harnesses two orthogonal click reactions, copper free alkyne-azide cycloaddition and thiol-vinylsulfone Michael addition, for attaching affinity molecules to AFM tips. The attachment chemistry was then validated by attaching antithrombin DNA aptamers and cyclo-RGD peptides to silicon nitride (SiN) tips, respectively, and measuring forces of unbinding these affinity molecules from their protein cognates human α-thrombin and human α5β1-integrin immobilized on mica surfaces. In turn, we used the same attachment chemistry to functionalize silicon tips with the same affinity molecules for AFM based recognition imaging, showing that the disease-relevant biomarkers such as α-thrombin and α5β1-integrin can be detected with high sensitivity and specificity by the single molecule technique. These studies demonstrate the feasibility of our attachment chemistry for the use in functionalization

  3. Application of Catalyst-free Click Reactions in Attaching Affinity Molecules to Tips of Atomic Force Microscopy for Detection of Protein Biomarkers

    PubMed Central

    Senapati, Subhadip; Manna, Saikat; Lindsay, Stuart; Zhang, Peiming

    2013-01-01

    Atomic Force Microscopy (AFM) has been extensively used in studies of biological interactions. Particularly, AFM based force spectroscopy and recognition imaging can sense biomolecules on a single molecule level, having great potential to become a tool for molecular diagnostics in clinics. These techniques, however, require affinity molecules to be attached to AFM tips in order to specifically detect their targets. The attachment chemistry currently used on silicon tips involves multiple steps of reactions and moisture sensitive chemicals, such as (3-aminopropyl)triethoxysilane (APTES) and N-hydroxysuccinimide (NHS) ester, making the process difficult to operate in aqueous solutions. In the present study, we have developed a user-friendly protocol to functionalize the AFM tips with affinity molecules. A key feature of it is that all reactions are carried out in aqueous solutions. In summary, we first synthesized a molecular anchor composed of cyclooctyne and silatrane for introduction of a chemically reactive function to AFM tips and a bi-functional polyethylene glycol linker that harnesses two orthogonal click reactions, copper free alkyne-azide cycloaddition and thiol-vinylsulfone Michael addition, for attaching affinity molecules to AFM tips. The attachment chemistry was then validated by attaching anti-thrombin DNA aptamers and cyclo-RGD peptides to silicon nitride (SiN) tips respectively, and measuring forces of unbinding these affinity molecules from their protein cognates human α-thrombin and human α5β1-integrin immobilized on mica surfaces. In turn, we used the same attachment chemistry to functionalize silicon tips with the same affinity molecules for AFM based recognition imaging, showing that the disease-relevant biomarkers such as α-thrombin and α5β1-integrin can be detected with high sensitivity and specificity by the single molecule technique. These studies demonstrate the feasibility of our attachment chemistry for the use in functionalization

  4. AFM nanoindentations of diatom biosilica surfaces.

    PubMed

    Losic, Dusan; Short, Ken; Mitchell, James G; Lal, Ratnesh; Voelcker, Nicolas H

    2007-04-24

    Diatoms have intricately and uniquely nanopatterned silica exoskeletons (frustules) and are a common target of biomimetic investigations. A better understanding of the diatom frustule structure and function at the nanoscale could provide new insights for the biomimetic fabrication of nanostructured ceramic materials and lightweight, yet strong, scaffold architectures. Here, we have mapped the nanoscale mechanical properties of Coscinodiscus sp. diatoms using atomic force microscopy (AFM)-based nanoindentation. Mechanical properties were correlated with the frustule structures obtained from high-resolution AFM and scanning electron microscopy (SEM). Significant differences in the micromechanical properties for the different frustule layers were observed. A comparative study of other related inorganic material including porous silicon films and free-standing membranes as well as porous alumina was also undertaken.

  5. Detection of Pathogens Using AFM and SPR

    NASA Astrophysics Data System (ADS)

    Vaseashta, Ashok

    2005-03-01

    A priori detection of pathogens in food and water has become a subject of paramount importance. Several recent incidents have resulted in the government passing stringent regulations for tolerable amounts of contamination of food products. Identification and/or monitoring of bacterial contamination in food are critical. The conventional methods of pathogen detection require time-consuming steps to arrive disembark at meaningful measurement in a timely manner as the detection time exceeds the time in which perishable food recycles through the food chain distribution. The aim of this presentation is to outline surface plasmon resonance (SPR) and atomic force microscopy (AFM) as two methods for fast detect6ion of pathogens. Theoretical basis of SPR and experimental results of SPR and AFM on E. coli O157:H7 and prion are presented.

  6. AFM Investigation of Liquid-Filled Polymer Microcapsules Elasticity.

    PubMed

    Sarrazin, Baptiste; Tsapis, Nicolas; Mousnier, Ludivine; Taulier, Nicolas; Urbach, Wladimir; Guenoun, Patrick

    2016-05-10

    Elasticity of polymer microcapsules (MCs) filled with a liquid fluorinated core is studied by atomic force microscopy (AFM). Accurately characterized spherical tips are employed to obtain the Young's moduli of MCs having four different shell thicknesses. We show that those moduli are effective ones because the samples are composites. The strong decrease of the effective MC elasticity (from 3.0 to 0.1 GPa) as the shell thickness decreases (from 200 to 10 nm) is analyzed using a novel numerical approach. This model describes the evolution of the elasticity of a coated half-space according to the contact radius, the thickness of the film, and the elastic moduli of bulk materials. This numerical model is consistent with the experimental data and allows simulating the elastic behavior of MCs at high frequencies (5 MHz). While the quasi-static elasticity of the MCs is found to be very dependent on the shell thickness, the high frequency (5 MHz) elastic behavior of the core leads to a stable behavior of the MCs (from 2.5 to 3 GPa according to the shell thickness). Finally, the effect of thermal annealing on the MCs elasticity is investigated. The Young's modulus is found to decrease because of the reduction of the shell thickness due to the loss of the polymer. PMID:27058449

  7. Dynamic modeling and sensitivity analysis of dAFM in the transient and steady state motions.

    PubMed

    Payam, Amir Farokh

    2016-10-01

    In this paper, based on the slow time varying function theory, dynamical equations for the amplitude and phase of the dynamic atomic force microscope are derived. Then, the sensitivity of the amplitude and phase to the dissipative and conservative parts of interaction force is investigated. The most advantage of this dynamical model is the ability to simulate and analysis the dynamics behavior of amplitude and phase of the AFM tip motion not only in the steady state but also in the transient regime. Using numerical analysis the transient and steady state behavior of amplitude and phase is studied and the sensitivity of amplitude and phase to the interaction force is analyzed. PMID:27448201

  8. Understanding the TERS Effect with On-line Tunneling and Force Feedback Using Multiprobe AFM/NSOM with Raman Integration

    NASA Astrophysics Data System (ADS)

    Lewis, Aaron; Dekhter, Rimma; Hamra, Patricia; Bar-David, Yossi; Taha, Hesham

    Tip enhanced Raman scattering (TERS) has evolved in several directions over the past years. The data from this variety of methodologies has now accumulated to the point that there is a reasonable possibility of evolving an understanding of the underlying cause of the resulting effects that could be the origin of the various TERS enhancement processes. The objective of this presentation is to use the results thus far with atomic force microscopy (AFM) probes with noble metal coating, etching, transparent gold nanoparticles with and without a second nanoparticle [Wang and Schultz, ANALYST 138, 3150 (2013)] and tunneling feedback probes [R. Zhang et. al., NATURE 4 9 8, 8 2 (2013)]. We attempt at understanding this complex of results with AFM/NSOM multiprobe techniques. Results indicate that TERS is dominated by complex quantum interactions. This produces a highly confined and broadband plasmon field with all k vectors for effective excitation. Normal force tuning fork feedback with exposed tip probes provides an excellent means to investigate these effects with TERS probes that we have shown can circumvent the vexing problem of jump to contact prevalent in conventional AFM methodology and permit on-line switching between tunneling and AFM feedback modes of operation.

  9. Cell visco-elasticity measured with AFM and optical trapping at sub-micrometer deformations.

    PubMed

    Nawaz, Schanila; Sánchez, Paula; Bodensiek, Kai; Li, Sai; Simons, Mikael; Schaap, Iwan A T

    2012-01-01

    The measurement of the elastic properties of cells is widely used as an indicator for cellular changes during differentiation, upon drug treatment, or resulting from the interaction with the supporting matrix. Elasticity is routinely quantified by indenting the cell with a probe of an AFM while applying nano-Newton forces. Because the resulting deformations are in the micrometer range, the measurements will be affected by the finite thickness of the cell, viscous effects and even cell damage induced by the experiment itself. Here, we have analyzed the response of single 3T3 fibroblasts that were indented with a micrometer-sized bead attached to an AFM cantilever at forces from 30-600 pN, resulting in indentations ranging from 0.2 to 1.2 micrometer. To investigate the cellular response at lower forces up to 10 pN, we developed an optical trap to indent the cell in vertical direction, normal to the plane of the coverslip. Deformations of up to two hundred nanometers achieved at forces of up to 30 pN showed a reversible, thus truly elastic response that was independent on the rate of deformation. We found that at such small deformations, the elastic modulus of 100 Pa is largely determined by the presence of the actin cortex. At higher indentations, viscous effects led to an increase of the apparent elastic modulus. This viscous contribution that followed a weak power law, increased at larger cell indentations. Both AFM and optical trapping indentation experiments give consistent results for the cell elasticity. Optical trapping has the benefit of a lower force noise, which allows a more accurate determination of the absolute indentation. The combination of both techniques allows the investigation of single cells at small and large indentations and enables the separation of their viscous and elastic components. PMID:23028915

  10. Antibody-based protein detection using piezoresistive cantilever arrays

    NASA Astrophysics Data System (ADS)

    Dauksaite, Vita; Lorentzen, Martin; Besenbacher, Flemming; Kjems, Jørgen

    2007-03-01

    A piezoresistive cantilever array platform with electrical read-out was applied for protein detection using GST (glutathione-S-transferase) and GST antibodies as a model system. Sensing was performed in the static deflection mode under constant flow conditions. The GST antibodies were directly immobilized on the cantilever gold surface by means of free thiol groups. The setup allowed simultaneous deflection measurements with sensor and control-antibody-immobilized reference cantilevers and enabled detection of 1 ng µl-1 (40 nM) of GST protein, which is similar to the sensitivity reported for cantilever sensors using an optical read-out system.

  11. Single stage evaluation of highly loaded high Mach number compressor stages. 6: Data and performance of cantilevered stator

    NASA Technical Reports Server (NTRS)

    Merrow, A. S.

    1972-01-01

    A compressor stage with a rotor tip speed of 1600 ft/sec was tested to evaluate its performance with a cantilevered stator and a rotating inner shroud beneath the stator. Both the rotor blades and the stator vanes were composed of multiple circular arc airfoil sections. Comparison of data taken during this test of the cantilevered stator and previous tests with the same compressor and airfoil geometry in a shroud stator configuration showed only slight differences in stage performance with no significant effect on overall efficiency. However, the severity of the stator wake near the rotating hub was decreased at all flows including the near surge condition. Stall and wise open discharge corrected weight flows were the same as for the shrouded stator configuration.

  12. Accuracy improvement of protrusion angle of carbon nanotube tips by precision multiaxis nanomanipulator

    SciTech Connect

    Young Song, Won; Young Jung, Ki; O, Beom-Hoan; Park, Byong Chon

    2005-02-01

    In order to manufacture a carbon nanotube (CNT) tip in which the attachment angle and position of CNT were precisely adjusted, a nanomanipulator was installed inside a scanning electron microscope (SEM). A CNT tip, atomic force microscopy (AFM) probe to which a nanotube is attached, is known to be the most appropriate probe for measuring the shape of high aspect ratio. The developed nanomanipulator has two sets of modules with the degree of freedom of three-directional rectilinear motion and one-directional rotational motion at an accuracy of tens of nanometers, so it enables the manufacturing of more accurate CNT tips. The present study developed a CNT tip with the error of attachment angle less then 10 deg. through three-dimensional operation of a multiwalled carbon nanotube and an AFM probe inside a SEM.

  13. Simulation of Tip-Sample Interaction in the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    Good, Brian S.; Banerjea, Amitava

    1994-01-01

    Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.

  14. Real-Time, Label-Free, All-Electrical Detection of Salmonella typhimurium Using Lead Zirconate Titanate/Gold-Coated Glass Cantilevers at any Relative Humidity

    PubMed Central

    Zhu, Qing; Shih, Wan Y.; Shih, Wei-Heng

    2007-01-01

    We have examined non-insulated PZT/gold-coated glass cantilevers for real-time, label-free detection of Salmonella t. by partial dipping at any relative humidity. The PZT/gold-coated glass cantilevers were consisted of a 0.127 mm thick PZT layer about 0.8 mm long, 2 mm wide bonded to a 0.15 mm thick gold-coated glass layer with a 3.0 mm long gold-coated glass tip for detection. We showed that by placing the water level at the nodal point, about 0.8 mm from the free end of the gold-glass tip, there was a 1-hr window in which the resonance frequency was stable despite the water level change by evaporation at 20% relative humidity or higher. By dipping the cantilevers to their nodal point, we were able to do real-time, label-free detection without background resonance frequency corrections at any relative humidity. The partially dipped PZT/gold-coated glass cantilever exhibited mass detection sensitivity, Δm/Δf = −5×10−11g/Hz, and a detection concentration sensitivity, 5×103 cells/ml in 2 ml of liquid, which was about two orders of magnitude lower than that of a 5 MHz QCM. It was also about two orders of magnitude lower than the infection dosage and one order of magnitude lower that the detection limit of a commercial Raptor sensor. PMID:22872784

  15. Real-Time, Label-Free, All-Electrical Detection of Salmonella typhimurium Using Lead Zirconate Titanate/Gold-Coated Glass Cantilevers at any Relative Humidity.

    PubMed

    Zhu, Qing; Shih, Wan Y; Shih, Wei-Heng

    2007-08-01

    We have examined non-insulated PZT/gold-coated glass cantilevers for real-time, label-free detection of Salmonella t. by partial dipping at any relative humidity. The PZT/gold-coated glass cantilevers were consisted of a 0.127 mm thick PZT layer about 0.8 mm long, 2 mm wide bonded to a 0.15 mm thick gold-coated glass layer with a 3.0 mm long gold-coated glass tip for detection. We showed that by placing the water level at the nodal point, about 0.8 mm from the free end of the gold-glass tip, there was a 1-hr window in which the resonance frequency was stable despite the water level change by evaporation at 20% relative humidity or higher. By dipping the cantilevers to their nodal point, we were able to do real-time, label-free detection without background resonance frequency corrections at any relative humidity. The partially dipped PZT/gold-coated glass cantilever exhibited mass detection sensitivity, Δm/Δf = -5×10(-11)g/Hz, and a detection concentration sensitivity, 5×10(3) cells/ml in 2 ml of liquid, which was about two orders of magnitude lower than that of a 5 MHz QCM. It was also about two orders of magnitude lower than the infection dosage and one order of magnitude lower that the detection limit of a commercial Raptor sensor.

  16. Plant protein interactions studied using AFM force spectroscopy: nanomechanical and adhesion properties.

    PubMed

    Fahs, Ahmad; Louarn, Guy

    2013-07-21

    The present work was focused on the nanomechanical and adhesion properties of the napin (2S albumin) and cruciferin (12S globulin) rapeseed (Brassica napus L.) proteins, respectively, a low and high molecular weight seed protein. Using chemically modified AFM tips, force spectroscopy experiments demonstrated notable differences in the tip-protein interaction strength with regard to the nature of the protein and pH of the aqueous environment. The results clearly underline the role of residence time and electrostatic interactions in the protein-protein adhesion force. Although the nanomechanical experiments concerned more than a single molecule, unfolding length and force characteristics of the rapeseed proteins have been statistically found to be sensitive to the structural properties of the protein. This study provides insight into the characterization of rapeseed proteins and then a better knowledge of their interaction and assembling at the nanoscale range.

  17. Plant protein interactions studied using AFM force spectroscopy: nanomechanical and adhesion properties.

    PubMed

    Fahs, Ahmad; Louarn, Guy

    2013-07-21

    The present work was focused on the nanomechanical and adhesion properties of the napin (2S albumin) and cruciferin (12S globulin) rapeseed (Brassica napus L.) proteins, respectively, a low and high molecular weight seed protein. Using chemically modified AFM tips, force spectroscopy experiments demonstrated notable differences in the tip-protein interaction strength with regard to the nature of the protein and pH of the aqueous environment. The results clearly underline the role of residence time and electrostatic interactions in the protein-protein adhesion force. Although the nanomechanical experiments concerned more than a single molecule, unfolding length and force characteristics of the rapeseed proteins have been statistically found to be sensitive to the structural properties of the protein. This study provides insight into the characterization of rapeseed proteins and then a better knowledge of their interaction and assembling at the nanoscale range. PMID:23732983

  18. Structure and stability of semiconductor tip apexes for atomic force microscopy.

    PubMed

    Pou, P; Ghasemi, S A; Jelinek, P; Lenosky, T; Goedecker, S; Perez, R

    2009-07-01

    The short range force between the tip and the surface atoms, that is responsible for atomic-scale contrast in atomic force microscopy (AFM), is mainly controlled by the tip apex. Thus, the ability to image, manipulate and chemically identify single atoms in semiconductor surfaces is ultimately determined by the apex structure and its composition. Here we present a detailed and systematic study of the most common structures that can be expected at the apex of the Si tips used in experiments. We tackle the determination of the structure and stability of Si tips with three different approaches: (i) first principles simulations of small tip apexes; (ii) simulated annealing of a Si cluster; and (iii) a minima hopping study of large Si tips. We have probed the tip apexes by making atomic contacts between the tips and then compared force-distance curves with the experimental short range forces obtained with dynamic force spectroscopy. The main conclusion is that although there are multiple stable solutions for the atomically sharp tip apexes, they can be grouped into a few types with characteristic atomic structures and properties. We also show that the structure of the last atomic layers in a tip apex can be both crystalline and amorphous. We corroborate that the atomically sharp tips are thermodynamically stable and that the tip-surface interaction helps to produce the atomic protrusion needed to get atomic resolution.

  19. Cellular mechanoadaptation to substrate mechanical properties: contributions of substrate stiffness and thickness to cell stiffness measurements using AFM.

    PubMed

    Vichare, Shirish; Sen, Shamik; Inamdar, Mandar M

    2014-02-28

    Mechanosensing by adherent cells is usually studied by quantifying cell responses on hydrogels that are covalently linked to a rigid substrate. Atomic force microscopy (AFM) represents a convenient way of characterizing the mechanoadaptation response of adherent cells on hydrogels of varying stiffness and thickness. Since AFM measurements reflect the effective cell stiffness, therefore, in addition to measuring real cytoskeletal alterations across different conditions, these measurements might also be influenced by the geometry and physical properties of the substrate itself. To better understand how the physical attributes of the gel influence AFM stiffness measurements of cells, we have used finite element analysis to simulate the indentation of cells of various spreads resting on hydrogels of varying stiffness and thickness. Consistent with experimental results, our simulation results indicate that for well spread cells, stiffness values are significantly over-estimated when experiments are performed on cells cultured on soft and thin gels. Using parametric studies, we have developed scaling relationships between the effective stiffness probed by AFM and the bulk cell stiffness, taking cell and tip geometry, hydrogel properties, nuclear stiffness and cell contractility into account. Finally, using simulated mechanoadaptation responses, we have demonstrated that a cell stiffening response may arise purely due to the substrate properties. Collectively, our results demonstrate the need to take hydrogel properties into account while estimating cell stiffness using AFM indentation. PMID:24651595

  20. ADHD: Tips to Try

    MedlinePlus

    ... How Can I Help a Friend Who Cuts? ADHD: Tips to Try KidsHealth > For Teens > ADHD: Tips to Try Print A A A Text Size en español TDAH: Consejos que puedes probar ADHD , or attention deficit hyperactivity disorder, is a medical ...

  1. Total Telephone Tips.

    ERIC Educational Resources Information Center

    Corder, Lloyd E.; And Others

    This manual of telephone behavior tips for business and sales professionals offers ways to handle the disgruntled caller and makes suggestions on topics relevant to the telephone. The manual is divided into the following sections and subsections: (1) Common Courtesy (staff tips, answering the telephone, screening calls, transferring calls, taking…

  2. Air Travel Health Tips

    MedlinePlus

    MENU Return to Web version Air Travel Health Tips Air Travel Health Tips How can I improve plane travel? Most people don't have any problems when ... and dosages of all of your medicines. The air in airplanes is dry, so drink nonalcoholic, decaffeinated ...

  3. BOREAS AFM-6 Surface Meteorological Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) collected surface meteorological data from 21 May to 20 Sep 1994 near the Southern Study Area-Old Jack Pine (SSA-OJP) tower site. The data are in tabular ASCII files. The surface meteorological data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  4. [Over projected tip].

    PubMed

    Duron, J-B; Nguyen, P S; Levet, Y; Bardot, J; Aiach, G

    2014-12-01

    Overprojected tip is a pretty usual request not easy to manage. Preop analysis is crucial in order to evaluate tip support and skin thickness and ability to retract. For example, if the skin is very thick and has poor chance to retract, the surgeon should be very careful in the tip projection decreasing to avoid a skin pollybeak deformity. In such cases, he has to analyze the facial proportions, especially other areas projection (radix, dorsum and chin) and think about augmenting them to balance the profile rather than decreasing tip projection. Correction should always be conducted incrementally, starting with weakening the tip support mechanisms and, only if necessary, continue with alar cartilage interruption. This can be performed on many areas (lateral cruras, domes, medial cruras) and with several techniques (resection or interruption+overlapping).

  5. Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus.

    PubMed

    Herruzo, Elena T; Garcia, Ricardo

    2012-01-01

    Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here we apply fractional calculus to express the frequency shift of the second eigenmode in terms of the fractional derivative of the interaction force. We show that this approximation is valid for situations in which the amplitude of the first mode is larger than the length of scale of the force, corresponding to the most common experimental case. We also show that this approximation is valid for very different types of tip-surface forces such as the Lennard-Jones and Derjaguin-Muller-Toporov forces. PMID:22496992

  6. Single Cell Wall Nonlinear Mechanics Revealed by a Multiscale Analysis of AFM Force-Indentation Curves.

    PubMed

    Digiuni, Simona; Berne-Dedieu, Annik; Martinez-Torres, Cristina; Szecsi, Judit; Bendahmane, Mohammed; Arneodo, Alain; Argoul, Françoise

    2015-05-01

    Individual plant cells are rather complex mechanical objects. Despite the fact that their wall mechanical strength may be weakened by comparison with their original tissue template, they nevertheless retain some generic properties of the mother tissue, namely the viscoelasticity and the shape of their walls, which are driven by their internal hydrostatic turgor pressure. This viscoelastic behavior, which affects the power-law response of these cells when indented by an atomic force cantilever with a pyramidal tip, is also very sensitive to the culture media. To our knowledge, we develop here an original analyzing method, based on a multiscale decomposition of force-indentation curves, that reveals and quantifies for the first time the nonlinearity of the mechanical response of living single plant cells upon mechanical deformation. Further comparing the nonlinear strain responses of these isolated cells in three different media, we reveal an alteration of their linear bending elastic regime in both hyper- and hypotonic conditions. PMID:25954881

  7. Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus.

    PubMed

    Herruzo, Elena T; Garcia, Ricardo

    2012-01-01

    Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here we apply fractional calculus to express the frequency shift of the second eigenmode in terms of the fractional derivative of the interaction force. We show that this approximation is valid for situations in which the amplitude of the first mode is larger than the length of scale of the force, corresponding to the most common experimental case. We also show that this approximation is valid for very different types of tip-surface forces such as the Lennard-Jones and Derjaguin-Muller-Toporov forces.

  8. Single Cell Wall Nonlinear Mechanics Revealed by a Multiscale Analysis of AFM Force-Indentation Curves

    PubMed Central

    Digiuni, Simona; Berne-Dedieu, Annik; Martinez-Torres, Cristina; Szecsi, Judit; Bendahmane, Mohammed; Arneodo, Alain; Argoul, Françoise

    2015-01-01

    Individual plant cells are rather complex mechanical objects. Despite the fact that their wall mechanical strength may be weakened by comparison with their original tissue template, they nevertheless retain some generic properties of the mother tissue, namely the viscoelasticity and the shape of their walls, which are driven by their internal hydrostatic turgor pressure. This viscoelastic behavior, which affects the power-law response of these cells when indented by an atomic force cantilever with a pyramidal tip, is also very sensitive to the culture media. To our knowledge, we develop here an original analyzing method, based on a multiscale decomposition of force-indentation curves, that reveals and quantifies for the first time the nonlinearity of the mechanical response of living single plant cells upon mechanical deformation. Further comparing the nonlinear strain responses of these isolated cells in three different media, we reveal an alteration of their linear bending elastic regime in both hyper- and hypotonic conditions. PMID:25954881

  9. Improved assembly processes for the Quartz Digital Accelerometer cantilever

    SciTech Connect

    Romero, A.M.; Gebert, C.T.

    1990-07-01

    This report covers the development of improved assembly processes for the Quartz Digital Accelerometer cantilever. In this report we discuss improved single-assembly tooling, the development of tooling and processes for precision application of polyimide adhesive, the development of the wafer scale assembly procedure, and the application of eutectic bonding to cantilever assembly. 2 refs., 17 figs.

  10. Use of Cantilever Mechanics for Impacted Teeth: Case Series

    PubMed Central

    Paduano, Sergio; Spagnuolo, Gianrico; Franzese, Gerardo; Pellegrino, Gioacchino; Valletta, Rosa; Cioffi, Iacopo

    2013-01-01

    This paper describes the orthodontic treatment, and the biomechanics of cantilevers for the impaction of permanent teeth in youngs, adolescents, and adults. In these case series, multibracket straightwire fixed appliances, together with cantilever mechanics, were used to treat the impaired occlusion. PMID:24511332

  11. CLOSEUP VIEW OF BOTTOM OF MAIN BRIDGE CANTILEVER THROUGH TRUSS ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    CLOSE-UP VIEW OF BOTTOM OF MAIN BRIDGE CANTILEVER THROUGH TRUSS SPAN SHOWING CANTILEVERED HIGHWAY FLOOR BRACKET LOOKING NORTHWEST AT PIER “II”. - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  12. Fiber-optic, cantilever-type acoustic motion velocity hydrophone.

    PubMed

    Cranch, G A; Miller, G A; Kirkendall, C K

    2012-07-01

    The interaction between fluid loaded fiber-optic cantilevers and a low frequency acoustic wave is investigated as the basis for an acoustic vector sensor. The displacements of the prototype cantilevers are measured with an integrated fiber laser strain sensor. A theoretical model predicting the frequency dependent shape of acoustically driven planar and cylindrical fiber-optic cantilevers incorporating effects of fluid viscosity is presented. The model demonstrates good agreement with the measured response of two prototype cantilevers, characterized with a vibrating water column, in the regime of Re ≥ 1. The performance of each cantilever geometry is also analyzed. Factors affecting the sensor performance such as fluid viscosity, laser mode profile, and support motion are considered. The planar cantilever is shown to experience the largest acoustically induced force and hence the highest acoustic responsivity. However, the cylindrical cantilever exhibits the smoothest response in water, due to the influence of viscous fluid damping, and is capable of two axis particle velocity measurement. These cantilevers are shown to be capable of achieving acoustic resolutions approaching the lowest sea-state ocean noise. PMID:22779459

  13. 11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD TOWARD NORTH PORTAL. Note vertical displacement in deck caused by partial collapse at point of connection between south cantilever arm and suspended span. - Smith River Bridge, CA State Highway 199 Spanning Smith River, Crescent City, Del Norte County, CA

  14. Hysteresis of the resonance frequency of magnetostrictive bending cantilevers

    NASA Astrophysics Data System (ADS)

    Löffler, Michael; Kremer, Ramona; Sutor, Alexander; Lerch, Reinhard

    2015-05-01

    Magnetostrictive bending cantilevers are applicable for wirelessly measuring physical quantities such as pressure and strain. Exploiting the ΔE-effect, the resonance frequency of the cantilevers is shifted because of a change in the magnetic biasing field. The biasing field, in turn, depends on the applied pressure or strain, respectively. With a view to the application as a reliable sensor, maximum sensitivity but minimum hysteresis in the biasing field/resonance frequency dependence is preferred. In this contribution, monomorph bending cantilevers fabricated using magnetostrictive Fe49Co49V2 and Metglas 2605SA1 are investigated regarding their applicability for future sensors. For this purpose, the biasing field-dependent polarization of the magnetostrictive materials and bending of the cantilevers are determined. Furthermore, a setup to magnetically bias the cantilevers and determine the bending resonance frequency is presented. Here, the resonance frequency is identified by measuring the impulse response employing a laser Doppler vibrometer. The measurement results reveal that cantilevers made of Fe49Co49V2 possess a distinct hysteretic behaviour at low magnetic biasing field magnitudes. This is ascribed to the polarization and bending hysteresis. Cantilevers fabricated using Metglas 2605SA1 feature a lower resonance frequency shift compared to cantilevers with Fe49Co49V2, which would result in a lower sensitivity of the sensor. However, their resonance frequency hysteresis is almost negligible.

  15. Resonating cantilever mass sensor with mechanical on-plane excitation

    NASA Astrophysics Data System (ADS)

    Teva, Jordi; Abadal, Gabriel; Jordà, Xavier; Borrise, Xavier; Davis, Zachary; Barniol, Nuria

    2003-04-01

    The aim of this paper is to report the experimental setup designed, developed and tested in order to achieve the first vibrating mode of a lateral cantilever with mechanical excitation. The on-plane oscillating cantilever is the basis of a proposed mass sensor with an expected resolution in the atto-gram scale. In a first system design, the cantilever is driven electrostatically by an electrode, which is placed parallel to the cantilever. The cantilever is driven to its first resonant mode applying an AC voltage between the cantilever and a driver. Also, a DC voltage is applied to increase the system response. The signal read-out of the transducer is the capacitive current of the cantilever-driver system. The mass sensor proposed, based on this cantilever-driver structure (CDS), is integrated with a CMOS circuitry in order to minimize the parasitic capacitances, that in this case take special relevance because of the low level output current coming from the transducer. Moreover, the electrostatic excitation introduces a parasitic current that overlaps the current due to the resonance. The mechanical excitation is an alternative excitation method which aim is to eliminate the excitation current. Here we describe the experimental facilities developed to achieve mechanical excitation and report preliminary results obtained by this excitation technique. The results are complemented with dynamic simulations of an equivalent system model that are in accordance with the experimental values.

  16. Mechanism of Material Removal in Nanomachining of Fused Quartz using AFM Diamond Tip

    NASA Astrophysics Data System (ADS)

    Ichida, Yoshio; Yamaguchi, Takashi; Sasanuma, Makoto

    Nanometer-scale machining experiments on fused quartz surfaces have been performed using an atomic force microscope combined with a two-axis capacitive force/displacement transducer. The minimum normal force fnP required to reproducibly form a groove was about 4.7 µN. The minimum critical normal force fnR, tangential force ftR and groove depth dgR when the material removal process began were found to be 33.7 µN, 18.7 µN, and 4.3 nm, respectively. Changes in the swelling ratio Rs and the ratio of force components at the critical normal force fnR can be used to detect a critical condition when the material deformation behavior changes from plastic deformation to material removal.

  17. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip.

    PubMed

    Gururajan, Giriprasath; Sullivan, S P; Beebe, T P; Chase, D B; Rabolt, J F

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  18. Efficient field emission from α-Fe2O3 nanoflakes on an atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Zhu, Y. W.; Yu, T.; Sow, C. H.; Liu, Y. J.; Wee, A. T. S.; Xu, X. J.; Lim, C. T.; Thong, J. T. L.

    2005-07-01

    Aligned arrays of flake-shaped hematite (α-Fe2O3) nanostructure have been fabricated on an atomic force microscope (AFM) tip. They are created by simply heating an iron-coated AFM tip in ambience on a hot plate. These nanoflakes are characterized as α-Fe2O3 single crystalline structures with tip radii as small as several nanometers and are highly effective as electron field emitters. With a vacuum gap of about 150μm, field emission measurements of α-Fe2O3 nanoflakes on AFM tips show a low turn-on voltage of about 400-600V and a high current density of 1.6Acm-2 under 900V. Such high emission current density is attributed to the nanoscale sharp tips of the as-grown nanoflakes. Based on the Fowler-Nordheim theory, it is demonstrated the enhancement factor of α-Fe2O3 nanoflakes on AFM tips is comparable to that of carbon nanotubes. Our findings suggest that α-Fe2O3 nanoflakes are potentially useful as candidates for future electron field emission devices.

  19. Fracture Growth Testing of Titanium 6AL-4V in AF-M315E

    NASA Technical Reports Server (NTRS)

    Sampson, Jeffrey W.; Martinez, Jonathan; McLean, Christopher

    2015-01-01

    The Green Propellant Infusion Mission (GPIM) will demonstrate the performance of AF-M315E monopropellant in orbit. Flight certification requires a safe-life analysis of the titanium alloy fuel tank to ensure inherent flaws will not cause failure during the design life. Material property inputs for this analysis require testing to determine the stress intensity factor for environmentally-assisted cracking (K (sub EAC)) of Ti 6Al-4V in combination with the AF-M315E monopropellant. Testing of single-edge notched specimens SE(B) representing the bulk tank membrane and weld material were performed in accordance with ASTM E1681. Specimens with fatigue pre-cracks were loaded into test fixtures so that the crack tips were exposed to the monopropellant at 50 degrees Centigrade for a duration of 1,000 hours. Specimens that did not fail during exposure were opened to inspect the crack surfaces for evidence of crack growth. The threshold stress intensity value, KEAC, is the highest applied stress intensity that produced neither a failure of the specimen during the exposure nor showed evidence of crack growth. The threshold stress intensity factor of the Ti 6Al-4V forged tank material when exposed to AF-M315E monopropellant was found to be at least 22.0 kilopounds per square inch. The stress intensity factor of the weld material was at least 31.3 kilopounds per square inch.

  20. Nano-scale Topographical Studies on the Growth Cones of Nerve Cells using AFM

    NASA Astrophysics Data System (ADS)

    Durkaya, Goksel; Zhong, Lei; Rehder, Vincent; Dietz, Nikolaus

    2009-11-01

    Nerve cells are the fundamental units which are responsible for intercommunication within the nervous system. The neurites, fibrous cable-like extensions for information delivery, of nerve cells are tipped by highly motile sensory structures known as the growth cones which execute important functions; neural construction, decision making and navigation during development and regeneration of the nervous system. The highly dynamic subcomponents of the growth cones are important in neural activity. Atomic Force Microscopy (AFM) is the most powerful microscopy technique which is capable of imaging without conductivity constraint and in liquid media. AFM providing nano-scale topographical information on biological structures is also informative on the physical properties such as: elasticity, adhesion, and softness. This contribution focuses on AFM analysis of the growth cones of the nerve cells removed from the buccal ganglion of Helisoma trivolvis. The results of nano-scale topography and softness analysis on growth cone central domain, filopodia and overlying lamellopodium (veil) are presented. The subcomponents of the growth cones of different nerve cells are compared to each other. The results of the analysis are linked to the mechanical properties and internal molecular density distribution of the growth cones.

  1. Robust energy harvesting from walking vibrations by means of nonlinear cantilever beams

    NASA Astrophysics Data System (ADS)

    Kluger, Jocelyn M.; Sapsis, Themistoklis P.; Slocum, Alexander H.

    2015-04-01

    In the present work we examine how mechanical nonlinearity can be appropriately utilized to achieve strong robustness of performance in an energy harvesting setting. More specifically, for energy harvesting applications, a great challenge is the uncertain character of the excitation. The combination of this uncertainty with the narrow range of good performance for linear oscillators creates the need for more robust designs that adapt to a wider range of excitation signals. A typical application of this kind is energy harvesting from walking vibrations. Depending on the particular characteristics of the person that walks as well as on the pace of walking, the excitation signal obtains completely different forms. In the present work we study a nonlinear spring mechanism that is composed of a cantilever wrapping around a curved surface as it deflects. While for the free cantilever, the force acting on the free tip depends linearly on the tip displacement, the utilization of a contact surface with the appropriate distribution of curvature leads to essentially nonlinear dependence between the tip displacement and the acting force. The studied nonlinear mechanism has favorable mechanical properties such as low frictional losses, minimal moving parts, and a rugged design that can withstand excessive loads. Through numerical simulations we illustrate that by utilizing this essentially nonlinear element in a 2 degrees-of-freedom (DOF) system, we obtain strongly nonlinear energy transfers between the modes of the system. We illustrate that this nonlinear behavior is associated with strong robustness over three radically different excitation signals that correspond to different walking paces. To validate the strong robustness properties of the 2DOF nonlinear system, we perform a direct parameter optimization for 1DOF and 2DOF linear systems as well as for a class of 1DOF and 2DOF systems with nonlinear springs similar to that of the cubic spring that are physically realized

  2. Cells mechanics with AFM: problems and solutions

    NASA Astrophysics Data System (ADS)

    Sokolov, Igor; Dokukin, Maxim; Guz, Nataliia

    2012-02-01

    Atomic force microscopy (AFM) is used to study mechanics of cells. Cell is far from being a homogeneous medium. This creates a number of problems which will be discussed as well as the ways to solve them. We will focus on the following problems: 1. Cellular surface brush (microvilli, glycocalyx..) surrounds cells. A simple model to separate the brush and cell deformation will be overviewed. 2. Problem of nonlinearity of stress-strain relation. Although unsolved, this may indirectly tested: the rigidity modulus should be reasonably independent of penetration. We will show that it can be achieved when using relatively dull AFM probes (the radii of microns) only. 3. Heterogeneity of cell surface. Cells are not homogeneous over the surface. We will discuss the question how many points is enough to characterize the cell. We will exemplify the above with human cervical epithelial cells. We will demonstrate that without proper consideration of the above problems, the error in defining the modulus of rigidity can easily reach an order of magnitude.

  3. Comparison of CD measurements of an EUV photomask by EUV scatterometry and CD-AFM

    NASA Astrophysics Data System (ADS)

    Scholze, Frank; Soltwisch, Victor; Dai, Gaoliang; Henn, Mark-Alexander; Gross, Hermann

    2013-09-01

    EUV scatterometry is a potential high-throughput measurement method for the characterization of EUV photomask structures. We present a comparison of angle resolved extreme ultraviolet (EUV) scatterometry and critical dimension atomic force microscope (CD-AFM) as a reference metrology for measurements of geometrical parameters like line width (CD), height and sidewall angle of EUV photomask structures. The structures investigated are dense and semidense bright and dark lines with different nominal CDs between 140 nm and 540 nm. The results show excellent linearity of the critical dimension measured with both methods within a range of only 1.8 nm and an offset of the absolute values below 3 nm. A maximum likelihood estimation (MLE) method is used to reconstruct the shape parameters and to estimate their uncertainties from the measured scattering efficiencies. The newly developed CD-AFM at PTB allows versatile measurements of parameters such as height, CD, sidewall angle, line edge/width roughness, corner rounding, and pitch. It applies flared tips to probe steep and even undercut sidewalls and employs a new vector approaching probing (VAP) strategy which enables very low tip wear and high measurement flexibility. Its traceability is ensured by a set of calibrated step-height and reference CD standards.

  4. Orthodontic Traction of Impacted Canine Using Cantilever

    PubMed Central

    Gonçalves, João Roberto; Cassano, Daniel Serra; Bianchi, Jonas

    2016-01-01

    The impaction of the maxillary canines causes relevant aesthetic and functional problems. The multidisciplinary approach to the proper planning and execution of orthodontic traction of the element in question is essential. Many strategies are cited in the literature; among them is the good biomechanical control in order to avoid possible side effects. The aim of this paper is to present a case report in which a superior canine impacted by palatine was pulled out with the aid of the cantilever on the Segmented Arch Technique (SAT) concept. A 14.7-year-old female patient appeared at clinic complaining about the absence of the upper right permanent canine. The proposed treatment prioritized the traction of the upper right canine without changing the occlusion and aesthetics. For this, it only installed the upper fixed appliance (Roth with slot 0.018), opting for SAT in order to minimize unwanted side effects. The use of cantilever to the traction of the upper right canine has enabled an efficient and predictable outcome, because it is of statically determined mechanics. PMID:27800192

  5. Structural insight into iodide uptake by AFm phases.

    PubMed

    Aimoz, Laure; Wieland, Erich; Taviot-Guého, Christine; Dähn, Rainer; Vespa, Marika; Churakov, Sergey V

    2012-04-01

    The ability of cement phases carrying positively charged surfaces to retard the mobility of (129)I, present as iodide (I(-)) in groundwater, was investigated in the context of safe disposal of radioactive waste. (125)I sorption experiments on ettringite, hydrotalcite, chloride-, carbonate- and sulfate-containing AFm phases indicated that calcium-monosulfate (AFm-SO(4)) is the only phase that takes up trace levels of iodide. The structures of AFm phases prepared by coprecipitating iodide with other anions were investigated in order to understand this preferential uptake mechanism. X-ray diffraction (XRD) investigations showed a segregation of monoiodide (AFm-I(2)) and Friedel's salt (AFm-Cl(2)) for I-Cl mixtures, whereas interstratifications of AFm-I(2) and hemicarboaluminate (AFm-OH-(CO(3))(0.5)) were observed for the I-CO(3) systems. In contrast, XRD measurements indicated the formation of a solid solution between AFm-I(2) and AFm-SO(4) for the I-SO(4) mixtures. Extended X-ray absorption fine structure spectroscopy showed a modification of the coordination environment of iodine in I-CO(3) and in I-SO(4) samples compared to pure AFm-I(2). This is assumed to be due to the introduction of stacking faults in I-CO(3) samples on one hand and due to the presence of sulfate and associated space-filling water molecules as close neighbors in I-SO(4) samples on the other hand. The formation of a solid solution between AFm-I(2) and AFm-SO(4), with a short-range mixing of iodide and sulfate, implies that AFm-SO(4) bears the potential to retard (129)I. PMID:22376086

  6. Bending and Shear Stresses Developed by the Instantaneous Arrest of the Root of a Moving Cantilever Beam

    NASA Technical Reports Server (NTRS)

    Stowell, Elbridge, Z; Schwartz, Edward B; Houbolt, John C

    1945-01-01

    A theoretical and experimental investigation has been made of the behavior of a cantilever beam in transverse motion when its root is suddenly brought to rest. Equations are given for determining the stresses, the deflections, and the accelerations that arise in the beam as a result of the impact. The theoretical equations, which have been confirmed experimentally, reveal that, at a given percentage of the distance from root to tip, the bending stresses for a particular mode are independent of the length of the beam, whereas the shear stresses vary inversely with the length.

  7. Focussed ion beam machined cantilever aperture probes for near-field optical imaging.

    PubMed

    Jin, E X; Xu, X

    2008-03-01

    Near-field optical probe is the key element of a near-field scanning optical microscopy (NSOM) system. The key innovation in the first two NSOM experiments (Pohl et al., 1984; Lewis et al., 1984) is the fabrications of a sub-wavelength optical aperture at the apex of a sharply pointed transparent probe tip with a thin metal coating. This paper discusses the routine use of focussed ion beam (FIB) to micro-machine NSOM aperture probes from the commercial silicon nitride cantilevered atomic force microscopy probes. Two FIB micro-machining approaches are used to form a nanoaperture of controllable size and shape at the apex of the tip. The FIB side slicing produces a silicon nitride aperture on the flat-end tips with controllable sizes varying from 120 nm to 30 nm. The FIB head-on drilling creates holes on the aluminium-coated tips with sizes down to 50 nm. Nanoapertures in C and bow tie shapes can also be patterned using the FIB head-on milling method to possibly enhance the optical transmission. A transmission-collection NSOM system is constructed from a commercial atomic force microscopy to characterize the optical resolution of FIB-micro-machined aperture tips. The optical resolution of 78 nm is demonstrated by an aperture probe fabricated by FIB head-on drilling. Simultaneous topography imaging can also be realized using the same probe. By mapping the optical near-field from a bow-tie aperture, optical resolution as small as 59 nm is achieved by an aperture probe fabricated by the FIB side slicing method. Overall, high resolution and reliable optical imaging of routinely FIB-micro-machined aperture probes are demonstrated.

  8. An elastography method based on the scanning contact resonance of a piezoelectric cantilever

    SciTech Connect

    Fu, Ji; Li, Faxin

    2013-12-15

    Purpose: Most tissues may become significantly stiffer than their normal states when there are lesions inside. The tissue's modulus can then act as an identification parameter for clinic diagnosis of tumors or fibrosis, which leads to elastography. This study introduces a novel elastography method that can be used for modulus imaging of superficial organs. Methods: This method is based on the scanning contact-resonance of a unimorph piezoelectric cantilever. The cantilever vibrates in its bending mode with the tip pressed tightly on the sample. The contact resonance frequency of the cantilever-sample system is tracked at each scanning point, from which the sample's modulus can be derived based on a beam dynamic model and a contact mechanics model. Scanning is performed by a three-dimensional motorized stage and the whole system is controlled by a homemade software program based on LabVIEW. Results: Testing onin vitro beef tissues indicates that the fat and the muscle can be easily distinguished using this system, and the accuracy of the modulus measurement can be comparable with that of nanoindentation. Imaging on homemade gelatin phantoms shows that the depth information of the abnormalities can be qualitatively obtained by varying the pressing force. The detection limit of this elastography method is specially examined both experimentally and numerically. Results show that it can detect the typical lesions in superficial organs with the depth of several centimeters. The lateral resolution of this elastography method/system is better than 0.5 mm, and could be further enhanced by using more scanning points. Conclusions: The proposed elastography system can be regarded as a sensitive palpation robot, which may be very promising in early diagnosis of tumors in superficial organs such as breast and thyroid.

  9. [AFM fishing of proteins under impulse electric field].

    PubMed

    Ivanov, Yu D; Pleshakova, T O; Malsagova, K A; Kaysheva, A L; Kopylov, A T; Izotov, A A; Tatur, V Yu; Vesnin, S G; Ivanova, N D; Ziborov, V S; Archakov, A I

    2016-05-01

    A combination of (atomic force microscopy)-based fishing (AFM-fishing) and mass spectrometry allows to capture protein molecules from solutions, concentrate and visualize them on an atomically flat surface of the AFM chip and identify by subsequent mass spectrometric analysis. In order to increase the AFM-fishing efficiency we have applied pulsed voltage with the rise time of the front of about 1 ns to the AFM chip. The AFM-chip was made using a conductive material, highly oriented pyrolytic graphite (HOPG). The increased efficiency of AFM-fishing has been demonstrated using detection of cytochrome b5 protein. Selection of the stimulating pulse with a rise time of 1 ns, corresponding to the GHz frequency range, by the effect of intrinsic emission from water observed in this frequency range during water injection into the cell. PMID:27562998

  10. [AFM fishing of proteins under impulse electric field].

    PubMed

    Ivanov, Yu D; Pleshakova, T O; Malsagova, K A; Kaysheva, A L; Kopylov, A T; Izotov, A A; Tatur, V Yu; Vesnin, S G; Ivanova, N D; Ziborov, V S; Archakov, A I

    2016-05-01

    A combination of (atomic force microscopy)-based fishing (AFM-fishing) and mass spectrometry allows to capture protein molecules from solutions, concentrate and visualize them on an atomically flat surface of the AFM chip and identify by subsequent mass spectrometric analysis. In order to increase the AFM-fishing efficiency we have applied pulsed voltage with the rise time of the front of about 1 ns to the AFM chip. The AFM-chip was made using a conductive material, highly oriented pyrolytic graphite (HOPG). The increased efficiency of AFM-fishing has been demonstrated using detection of cytochrome b5 protein. Selection of the stimulating pulse with a rise time of 1 ns, corresponding to the GHz frequency range, by the effect of intrinsic emission from water observed in this frequency range during water injection into the cell.

  11. Tips for labor coaches

    MedlinePlus

    ... some tips for getting prepared. Before the big day arrives Labor coaches should go to childbirth classes ... get through her labor and delivery. When the day arrives You might be at the hospital for ...

  12. Technology Tips: A Potpourri.

    ERIC Educational Resources Information Center

    Cuoco, Albert A.; And Others, Eds.

    1994-01-01

    Contains tips from readers about using technology in the classroom, including notebook computers, classroom sets of calculators, geometry software, LOGO software, publisher discounts, curriculum materials in CD-ROM, and volunteer help in computers and computer networking for schools. (MKR)

  13. Tips for Daily Living

    MedlinePlus

    ... After Stroke Weight Training After Stroke Tips for Improving Fine Motor Skills Functional Tone Management Arm Training Program Constraint-Induced Movement Therapy Emotional & Behavioral Challenges Self-Esteem after Stroke Post-Stroke Mood Disorders One-side ...

  14. Microsphere-based cantilevers for polarization-resolved and femtosecond SNOM

    NASA Astrophysics Data System (ADS)

    González Mora, C. A.; Hartelt, M.; Bayer, D.; Aeschlimann, M.; Ilin, E. A.; Oesterschulze, E.

    2016-04-01

    We present a cantilever-based near-field probe with integrated Mie scattering dielectric SiO2 microsphere (MSDM) for near-field optical imaging as well as femtosecond spectroscopy applications. In contrast to the state-of-the-art transmissive near-field probes, the MSDM reveals a transmission of almost unity known from far-field microscopy configuration. For proper handling, the microsphere is integrated at the apex of a conventional pyramidal aperture tip carried by an atomic force microscopy cantilever. It proved to be mechanically robust during the scanning process even if operating it in the contact mode. The spherical symmetry provides on the one hand a well-defined mechanical contact point with the sample irrespective of its inclination angle to the sample surface. On the other hand, the symmetry of the device preserves the polarization of light proving to be useful for the investigation of the polarization dependent behavior of plasmonic nanostructures. The high transmission combined with low dispersion renders spectroscopic investigations on the femtosecond timescale with a moderate lateral resolution. Second order autocorrelation experiments on a BBO crystal reveals a time resolution well below 100 {fs at } 191 {nm} spatial resolution.

  15. Ten Tips for Teachers

    ERIC Educational Resources Information Center

    Mahon, Robert Lee

    2005-01-01

    In this article, the author shares some tips for teachers. His tips are as follows: (1) a teacher should forget his or her education; (2) a teacher should forget the theory (3) a teacher should remember that he or she is a translator, not an originator; (4) a teacher should respect his or her students; (5) a teacher should be true to his or her…

  16. BOREAS AFM-6 Boundary Layer Height Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) site. This data set provides boundary layer height information over the site. The data were collected from 21 May 1994 to 20 Sep 1994 and are stored in tabular ASCII files. The boundary layer height data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  17. BOREAS AFM-06 Mean Wind Profile Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Administration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) tower from 21 May 1994 to 20 Sep 1994. The data set provides wind profiles at 38 heights, containing the variables of wind speed; wind direction; and the u-, v-, and w-components of the total wind. The data are stored in tabular ASCII files. The mean wind profile data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  18. BOREAS AFM-06 Mean Temperature Profile Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) tower from 21 May 1994 to 20 Sep 1994. The data set provides temperature profiles at 15 heights, containing the variables of virtual temperature, vertical velocity, the speed of sound, and w-bar. The data are stored in tabular ASCII files. The mean temperature profile data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  19. Sensitivity of inelastic response to numerical integration of strain energy. [for cantilever beam

    NASA Technical Reports Server (NTRS)

    Kamat, M. P.

    1976-01-01

    The exact solution to the quasi-static, inelastic response of a cantilever beam of rectangular cross section subjected to a bending moment at the tip is obtained. The material of the beam is assumed to be linearly elastic-linearly strain-hardening. This solution is then compared with three different numerical solutions of the same problem obtained by minimizing the total potential energy using Gaussian quadratures of two different orders and a Newton-Cotes scheme for integrating the strain energy of deformation. Significant differences between the exact dissipative strain energy and its numerical counterpart are emphasized. The consequence of this on the nonlinear transient responses of a beam with solid cross section and that of a thin-walled beam on elastic supports under impulsive loads are examined.

  20. Multifunctional cantilever-free scanning probe arrays coated with multilayer graphene

    PubMed Central

    Shim, Wooyoung; Brown, Keith A.; Zhou, Xiaozhu; Rasin, Boris; Liao, Xing; Mirkin, Chad A.

    2012-01-01

    Scanning probe instruments have expanded beyond their traditional role as imaging or “reading” tools and are now routinely used for “writing.” Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning probe lithography technique to become widely applied, there needs to be a reasonable path toward a scalable architecture. Here, we use a multilayer graphene coating method to create multifunctional massively parallel probe arrays that have wear-resistant tips of uncompromised sharpness and high electrical and thermal conductivities. The optical transparency and mechanical flexibility of graphene allow this procedure to be used for coating exceptionally large, cantilever-free arrays that can pattern with electrochemical desorption and thermal, in addition to conventional, dip-pen nanolithography. PMID:23086161