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Sample records for afm cantilever tip

  1. Analyzing the vibrational response of an AFM cantilever in liquid with the consideration of tip mass by comparing the hydrodynamic and contact repulsive force models in higher modes

    NASA Astrophysics Data System (ADS)

    Korayem, Moharam Habibnejad; Nahavandi, Amir

    2017-04-01

    This paper investigates the vibration of a tapping-mode Atomic Force Microscope (AFM) cantilever covered with two whole piezoelectric layers in a liquid medium. The authors of this article have already modeled the vibration of a cantilever immersed in liquid over rough surfaces. Five new ideas have been considered for improving the results of the previous work. Mass and damping of a cantilever probe tip have been considered. Since the probe tip of an AFM cantilever has a mass, which can itself affect the natural frequency of vibration, the significance of this mass has been explored. Also, two hydrodynamic force models for analyzing the mass and damping added to a cantilever in liquid medium have been evaluated. In modeling the vibration of a cantilever in liquid, simplifications are made to the theoretical equations used in the modeling, which may make the obtained results different from those in the real case. So, two hydrodynamic force models are introduced and compared with each other. In addition to the already introduced DMT model, the JKR model has been proposed. The forces acting on a probe tip have attractive and repulsive effects. The attractive Van der Waals force can vary depending on the surface smoothness or roughness, and the repulsive contact force, which is independent of the type of surface roughness and usually varies with the hardness or softness of a surface. When the first mode is used in the vibration of an AFM cantilever, the changes of the existing physical parameters in the simulation do not usually produce a significant difference in the response. Thus, three cantilever vibration modes have been investigated. Finally, an analytical approach for obtaining the response of equations is presented which solves the resulting motion equation by the Laplace method and, thus, a time function is obtained for cantilever deflection is determined. Also, using the COMSOL software to model a cantilever in a liquid medium, the computed natural

  2. 3D simulation of AFM non-uniform piezoelectric micro-cantilever with various geometries subjected to the tip-sample forces

    NASA Astrophysics Data System (ADS)

    Korayem, Alireza Habibnejad; Abdi, Moein

    2017-03-01

    Atomic force microscope (AFM) is a powerful instrument for investigation of surface topography at different workspaces. It is important to understand the dynamic behavior of AFM to improve its performance. 3D numerical method is suitable in order to simulate experimental conditions. This paper has investigated modeling and dynamic simulation of rectangular, Dagger and V-shaped geometries of AFM piezoelectric micro-cantilever (MC) with two electrode layers in the air environment. For a better understanding of the system dynamic, multi-layer MC dynamic equation has been derived. Euler-Bernoulli beam theory has been used for modeling the AFM cantilever. Hamilton's principle has been used for the MC modeling and the finite element method (FEM) has been applied for its discretization. In 3D, with respect to the tip-sample forces piezoelectric MC has been simulated via the COMSOL software. The frequency and time responses have been also investigated. The topographies have been performed on different surfaces with various roughness's types in the tapping and non-contact mode. The results of these two methods have been compared with experimental results. Moreover, the effects of MC geometrical parameters on surfaces topography and frequency responses have been studied and optimal dimensions of topographies have been obtained for each of the beam geometries. Simulations of various tip geometries have been performed in order to examine the effects of tip dimensions on the frequency and time responses. Furthermore, the effect of tip displacement on the frequency response has been investigated for different MC lengths.

  3. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.

    PubMed

    Gates, Richard S; Pratt, Jon R

    2012-09-21

    Accurate cantilever spring constants are important in atomic force microscopy both in control of sensitive imaging and to provide correct nanomechanical property measurements. Conventional atomic force microscope (AFM) spring constant calibration techniques are usually performed in an AFM. They rely on significant handling and often require touching the cantilever probe tip to a surface to calibrate the optical lever sensitivity of the configuration. This can damage the tip. The thermal calibration technique developed for laser Doppler vibrometry (LDV) can be used to calibrate cantilevers without handling or touching the tip to a surface. Both flexural and torsional spring constants can be measured. Using both Euler-Bernoulli modeling and an SI traceable electrostatic force balance technique as a comparison we demonstrate that the LDV thermal technique is capable of providing rapid calibrations with a combination of ease, accuracy and precision beyond anything previously available.

  4. Low tip damage AFM technique development for nano structures characterization

    NASA Astrophysics Data System (ADS)

    Liu, Biao; Wang, Charles C.; Huang, Po-Fu; Uritsky, Yuri

    2010-06-01

    Ambient dynamic mode (tapping mode or intermittent-contact mode) AFM imaging has been used extensively for the characterization of the topography of nano structures. However, the results are beset with artifacts, because hard tapping of the AFM tip on sample surface usually causes premature tip damage. Through careful study of the cantilever amplitude and phase signals as functions of tip-to-sample distance, principle of non-contact AFM operation was discovered to enable high resolution and low tip damage AFM image acquisition [1, 2]. However, current study discovers that the conventional way of acquiring amplitude and phase versus distance curves gives erroneous non-contact operating range, because the tip gets damaged during the data acquisition process. A new technique is developed to reliably map the operating parameters of an intact tip that ensures the AFM be operated with the correct non-contact settings. Two examples are given to illustrate the successful applications of this new technique. The first example involves the size characterization of polystyrene latex (PSL) nano particles used for light scattering tool calibration. The second example is the development of robust recipes for the measurement of the depth of phase-shift mask trenches.

  5. Interlaboratory round robin on cantilever calibration for AFM force spectroscopy.

    PubMed

    te Riet, Joost; Katan, Allard J; Rankl, Christian; Stahl, Stefan W; van Buul, Arend M; Phang, In Yee; Gomez-Casado, Alberto; Schön, Peter; Gerritsen, Jan W; Cambi, Alessandra; Rowan, Alan E; Vancso, G Julius; Jonkheijm, Pascal; Huskens, Jurriaan; Oosterkamp, Tjerk H; Gaub, Hermann; Hinterdorfer, Peter; Figdor, Carl G; Speller, Sylvia

    2011-12-01

    Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rely on accurately determined cantilever spring constants. Hence, to calibrate cantilevers, a reliable calibration protocol is essential. Although the thermal noise method and the direct Sader method are frequently used for cantilever calibration, there is no consensus on the optimal calibration of soft and V-shaped cantilevers, especially those used in force spectroscopy. Therefore, in this study we aimed at establishing a commonly accepted approach to accurately calibrate compliant and V-shaped cantilevers. In a round robin experiment involving eight different laboratories we compared the thermal noise and the Sader method on ten commercial and custom-built AFMs. We found that spring constants of both rectangular and V-shaped cantilevers can accurately be determined with both methods, although the Sader method proved to be superior. Furthermore, we observed that simultaneous application of both methods on an AFM proved an accurate consistency check of the instrument and thus provides optimal and highly reproducible calibration. To illustrate the importance of optimal calibration, we show that for biological force spectroscopy studies, an erroneously calibrated cantilever can significantly affect the derived (bio)physical parameters. Taken together, our findings demonstrated that with the pre-established protocol described reliable spring constants can be obtained for different types of cantilevers.

  6. Controlled tip wear on high roughness surfaces yields gradual broadening and rounding of cantilever tips

    NASA Astrophysics Data System (ADS)

    Vorselen, Daan; Kooreman, Ernst S.; Wuite, Gijs J. L.; Roos, Wouter H.

    2016-11-01

    Tip size in atomic force microscopy (AFM) has a major impact on the resolution of images and on the results of nanoindentation experiments. Tip wear is therefore a key limitation in the application of AFM. Here we show, however, how wear can be turned into an advantage as it allows for directed tip shaping. We studied tip wear on high roughness polycrystalline titanium and diamond surfaces and show that tip wear on these surfaces leads to an increased tip size with a rounded shape of the apex. Next, we fitted single peaks from AFM images in order to track the changes in tip radius over time. This method is in excellent agreement with the conventional blind tip reconstruction method with the additional advantage that we could use it to demonstrate that the increase in tip size is gradual. Moreover, with our approach we can shape and control the tip size, while retaining identical chemical and cantilever properties. This significantly expands the reproducibility of AFM force spectroscopy data and is therefore expected to find a wide applicability.

  7. Controlled tip wear on high roughness surfaces yields gradual broadening and rounding of cantilever tips

    PubMed Central

    Vorselen, Daan; Kooreman, Ernst S.; Wuite, Gijs J. L.; Roos, Wouter H.

    2016-01-01

    Tip size in atomic force microscopy (AFM) has a major impact on the resolution of images and on the results of nanoindentation experiments. Tip wear is therefore a key limitation in the application of AFM. Here we show, however, how wear can be turned into an advantage as it allows for directed tip shaping. We studied tip wear on high roughness polycrystalline titanium and diamond surfaces and show that tip wear on these surfaces leads to an increased tip size with a rounded shape of the apex. Next, we fitted single peaks from AFM images in order to track the changes in tip radius over time. This method is in excellent agreement with the conventional blind tip reconstruction method with the additional advantage that we could use it to demonstrate that the increase in tip size is gradual. Moreover, with our approach we can shape and control the tip size, while retaining identical chemical and cantilever properties. This significantly expands the reproducibility of AFM force spectroscopy data and is therefore expected to find a wide applicability. PMID:27833143

  8. Cantilever's behavior in the AC mode of an AFM

    SciTech Connect

    Nunes, V.B.; Zanette, S.I.; Caride, A.O.; Prioli, R.; Rivas, A.M.F

    2003-03-15

    In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence-from noncontact to tapping operating mode-on the height of the contamination layer and on the stiffness of the sample.

  9. Intrinsically High-Q Dynamic AFM Imaging in Liquid with a Significantly Extended Needle Tip

    PubMed Central

    Minary-Jolandan, Majid; Tajik, Arash; Wang, Ning; Yu, Min-Feng

    2012-01-01

    Atomic force microscope (AFM) probe with a long and rigid needle tip was fabricated and studied for high Q factor dynamic (tapping mode) AFM imaging of samples submersed in liquid. The extended needle tip over a regular commercially-available tapping mode AFM cantilever was sufficiently long to keep the AFM cantilever from submersed in liquid, which significantly minimized the hydrodynamic damping involved in dynamic AFM imaging of samples in liquid. Dynamic AFM imaging of samples in liquid at an intrinsic Q factor of over 100 and an operation frequency of over 200 kHz was demonstrated. The method has the potential to be extended to acquire viscoelastic materials properties and provide truly gentle imaging of soft biological samples in physiological environments. PMID:22595833

  10. SU-8 hollow cantilevers for AFM cell adhesion studies

    NASA Astrophysics Data System (ADS)

    Martinez, Vincent; Behr, Pascal; Drechsler, Ute; Polesel-Maris, Jérôme; Potthoff, Eva; Vörös, Janos; Zambelli, Tomaso

    2016-05-01

    A novel fabrication method was established to produce flexible, transparent, and robust tipless hollow atomic force microscopy (AFM) cantilevers made entirely from SU-8. Channels of 3 μm thickness and several millimeters length were integrated into 12 μm thick and 40 μm wide cantilevers. Connected to a pressure controller, the devices showed high sealing performance with no leakage up to 6 bars. Changing the cantilever lengths from 100 μm to 500 μm among the same wafer allowed the targeting of various spring constants ranging from 0.5 to 80 N m-1 within a single fabrication run. These hollow polymeric AFM cantilevers were operated in the optical beam deflection configuration. To demonstrate the performance of the device, single-cell force spectroscopy experiments were performed with a single probe detaching in a serial protocol more than 100 Saccharomyces cerevisiae yeast cells from plain glass and glass coated with polydopamine while measuring adhesion forces in the sub-nanoNewton range. SU-8 now offers a new alternative to conventional silicon-based hollow cantilevers with more flexibility in terms of complex geometric design and surface chemistry modification.

  11. Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit.

    PubMed

    Dixson, Ronald G; Orji, Ndubuisi G; Goldband, Ryan S

    2016-01-25

    Sidewall sensing in critical dimension atomic force microscopes (CD-AFMs) usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM) probes. All methods of tip position control, however, induce an effective tip width that may deviate from the actual geometrical tip width. Understanding the influence and dependence of the effective tip width on the dither settings and lateral stiffness of the tip can improve the measurement accuracy and uncertainty estimation for CD-AFM measurements. Since CD-AFM typically uses tips that range from 15 nm to 850 nm in geometrical width, the behavior of effective tip width throughout this range should be understood. The National Institute of Standards and Technology (NIST) has been investigating the dependence of effective tip width on the dither settings and lateral stiffness of the tip, as well as the possibility of material effects due to sample composition. For tip widths of 130 nm and lower, which also have lower lateral stiffness, the response of the effective tip width to lateral dither is greater than for larger tips. However, we have concluded that these effects will not generally result in a residual bias, provided that the tip calibration and sample measurement are performed under the same conditions. To validate that our prior conclusions about the dependence of effective tip width on lateral stiffness are valid for large CD-tips, we recently performed experiments using a very large non-CD tip with an etched plateau of approximately 2 μm width. The effective lateral stiffness of these tips is at least 20 times greater than typical CD-AFM tips, and these results supported our prior conclusions about the expected behavior for larger tips. The bottom-line importance of these latest observations is that we can now reasonably conclude that a dither slope of 3 nm

  12. Cantilever energy effects on bimodal AFM: phase and amplitude contrast of multicomponent samples

    NASA Astrophysics Data System (ADS)

    Chakraborty, Ishita; Yablon, Dalia G.

    2013-11-01

    Bimodal atomic force microscopy (AFM) is a recently developed technique of dynamic AFM where a higher eigenmode of the cantilever is simultaneously excited along with the fundamental eigenmode. The effects of different operating parameters while imaging an impact copolymer blend of polypropylene (PP) and ethylene-propylene (E-P) rubber in bimodal mode are explored through experiments and numerical simulations. The higher mode amplitude and phase contrasts between the two components of the sample reverse at different points as the free amplitude of the higher eigenmode is increased. Three different regimes are identified experimentally depending on the relative contrast between the PP and the E-P rubber. It is observed that the kinetic energy and free air drive input energy of the two cantilever eigenmodes play a role in determining the regimes of operation. Numerical simulations conducted with appropriate tip-sample interaction forces support the experimental results. An understanding of these regimes and the associated cantilever dynamics will guide a rational approach towards selecting appropriate operating parameters.

  13. Cantilever energy effects on bimodal AFM: phase and amplitude contrast of multicomponent samples.

    PubMed

    Chakraborty, Ishita; Yablon, Dalia G

    2013-11-29

    Bimodal atomic force microscopy (AFM) is a recently developed technique of dynamic AFM where a higher eigenmode of the cantilever is simultaneously excited along with the fundamental eigenmode. The effects of different operating parameters while imaging an impact copolymer blend of polypropylene (PP) and ethylene-propylene (E-P) rubber in bimodal mode are explored through experiments and numerical simulations. The higher mode amplitude and phase contrasts between the two components of the sample reverse at different points as the free amplitude of the higher eigenmode is increased. Three different regimes are identified experimentally depending on the relative contrast between the PP and the E-P rubber. It is observed that the kinetic energy and free air drive input energy of the two cantilever eigenmodes play a role in determining the regimes of operation. Numerical simulations conducted with appropriate tip-sample interaction forces support the experimental results. An understanding of these regimes and the associated cantilever dynamics will guide a rational approach towards selecting appropriate operating parameters.

  14. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.

    PubMed

    Naitoh, Yoshitaka; Kinoshita, Yukinori; Jun Li, Yan; Kageshima, Masami; Sugawara, Yasuhiro

    2009-07-01

    A sharp probe tip with atomic scale stability is essential and desirable for noncontact atomic force microscopy (NC-AFM) studies at the atomic scale. We observed a Ge(001) surface using both a Si cantilever and a tungsten coated Si cantilever at room temperature in order to investigate the influence of the tip apex structure on the NC-AFM images. By using the Si cantilever, we first obtained four types of image at the atomic scale which can be explained assuming a dimer structure on the tip apex. On the other hand, the home-made tungsten coated tip, which has atomic scale stability and high electric conductivity, imaged the so-called ordered c(4 x 2) structure without any artifacts. The tungsten coated cantilever was found to have significantly higher performance for NC-AFM studies at the atomic scale than the Si cantilever.

  15. Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires

    DOEpatents

    Lee, James Weifu; Lowndes, Douglas H.; Merkulov, Vladimir I.; Eres, Gyula; Wei, Yayi; Greenbaum, Elias; Lee, Ida

    2004-06-29

    A method is described for catalyst-induced growth of carbon nanotubes, nanofibers, and other nanostructures on the tips of nanowires, cantilevers, conductive micro/nanometer structures, wafers and the like. The method can be used for production of carbon nanotube-anchored cantilevers that can significantly improve the performance of scaning probe microscopy (AFM, EFM etc). The invention can also be used in many other processes of micro and/or nanofabrication with carbon nanotubes/fibers. Key elements of this invention include: (1) Proper selection of a metal catalyst and programmable pulsed electrolytic deposition of the desired specific catalyst precisely at the tip of a substrate, (2) Catalyst-induced growth of carbon nanotubes/fibers at the catalyst-deposited tips, (3) Control of carbon nanotube/fiber growth pattern by manipulation of tip shape and growth conditions, and (4) Automation for mass production.

  16. Insulated Conducting Cantilevered Nanotips and Two-Chamber Recording System for High Resolution Ion Sensing AFM

    PubMed Central

    Meckes, Brian; Arce, Fernando Teran; Connelly, Laura S.; Lal, Ratnesh

    2014-01-01

    Biological membranes contain ion channels, which are nanoscale pores allowing controlled ionic transport and mediating key biological functions underlying normal/abnormal living. Synthetic membranes with defined pores are being developed to control various processes, including filtration of pollutants, charge transport for energy storage, and separation of fluids and molecules. Although ionic transport (currents) can be measured with single channel resolution, imaging their structure and ionic currents simultaneously is difficult. Atomic force microscopy enables high resolution imaging of nanoscale structures and can be modified to measure ionic currents simultaneously. Moreover, the ionic currents can also be used to image structures. A simple method for fabricating conducting AFM cantilevers to image pore structures at high resolution is reported. Tungsten microwires with nanoscale tips are insulated except at the apex. This allows simultaneous imaging via cantilever deflections in normal AFM force feedback mode as well as measuring localized ionic currents. These novel probes measure ionic currents as small as picoampere while providing nanoscale spatial resolution surface topography and is suitable for measuring ionic currents and conductance of biological ion channels. PMID:24663394

  17. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  18. Dynamic response of AFM cantilevers to dissimilar functionalized silica surfaces in aqueous electrolyte solutions.

    PubMed

    Wu, Yan; Misra, Sambit; Karacor, M Basar; Prakash, Shaurya; Shannon, Mark A

    2010-11-16

    The dynamic response of an oscillating microcantilever with a gold-coated tip interacting with dissimilar functionalized silica surfaces was studied in electrolyte solutions with pH ranging from 4 to 9. Silica surfaces were chemically modified, yielding dissimilar surfaces with -Br, -NH(2), and -CH(3) functional group terminations. The relative hydrophobicity of the surfaces was characterized by contact angle measurements. The surface charge of the functionalized surfaces was first probed with commonly used static AFM measurements and serves as a reference to the dynamic response data. The amplitude and phase of the cantilever oscillation were monitored and used to calculate the effective interaction stiffness and damping coefficient, which relate to the electrical double layer interactions and also to distance-dependent hydrodynamic damping at the solid/water interface. The data for the dynamic response of the AFM over silica surfaces as a function of chemical functionalization and electrolyte pH show that the effective stiffness has a distinctive dependence on the surface charge of functionalized silica surfaces. The hydrodynamic damping also correlates strongly with the relative hydrophobicity of the surface. The data reported here indicate that interfacial properties can be strongly affected by changing the chemical composition of surfaces.

  19. Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation.

    PubMed

    Korayem, Moharam Habibnejad; Saraie, Maniya B; Saraee, Mahdieh B

    2017-01-13

    An important challenge when using an atomic force microscope (AFM) is to be able to control the force exerted by the AFM for performing various tasks. Nevertheless, the exerted force is proportional to the deflection of the AFM cantilever, which itself is affected by a cantilever's stiffness coefficient. Many papers have been published so far on the methods of obtaining the stiffness coefficients of AFM cantilevers in 2D; however, a comprehensive model is yet to be presented on 3D cantilever motion. The discrepancies between the equations of the 2D and 3D analysis are due to the number and direction of forces and moments that are applied to a cantilever. Moreover, in the 3D analysis, contrary to the 2D analysis, due to the interaction between the forces and moments applied on a cantilever, its stiffness values cannot be separately expressed for each direction; and instead, a stiffness matrix should be used to correctly derive the relevant equations. In this paper, 3D stiffness coefficient matrices have been obtained for three common cantilever geometries including the rectangular, V-shape and dagger-shape cantilevers. The obtained equations are validated by two methods. In the first approach, the Finite Element Method is combined with the cantilever deflection values computed by using the obtained stiffness matrices. In the second approach, by reducing the problem's parameters, the forces applied on a cantilever along different directions are compared with each other in 2D and 3D cases. Then the 3D manipulation of a stiff nanoparticle is modeled and simulated by using the stiffness matrices obtained for the three cantilever geometries. The obtained results indicate that during the manipulation process, the dagger-shaped and rectangular cantilevers exert the maximum and minimum amounts of forces on the stiff nanoparticle, respectively. Also, by examining the effects of different probe tip geometries, it is realized that a probe tip of cylindrical geometry exerts the

  20. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction.

    PubMed

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-07-25

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation.

  1. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    NASA Astrophysics Data System (ADS)

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-07-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation.

  2. Nano-Wilhelmy investigation of dynamic wetting properties of AFM tips through tip-nanobubble interaction

    PubMed Central

    Wang, Yuliang; Wang, Huimin; Bi, Shusheng; Guo, Bin

    2016-01-01

    The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during extension and retraction motion of AFM tips relative to interfacial nanobubbles. The working principle of the proposed method and mathematic models for dynamic contact angle measurement are presented. Geometric models of AFM tips were constructed using scanning electronic microscopy (SEM) images taken from different view directions. The detailed process of tip-nanobubble interaction was investigated using force-distance curves of AFM on nanobubbles. Several parameters including nanobubble height, adhesion and capillary force between tip and nanobubbles are extracted. The variation of these parameters was studied over nanobubble surfaces. The dynamic contact angles of the AFM tips were calculated from the capillary force measurements. The proposed method provides direct measurement of dynamic contact angles for AFM tips and can also be taken as a general approach for nanoscale dynamic wetting property investigation. PMID:27452115

  3. High-speed AFM probe with micromachined membrane tip

    NASA Astrophysics Data System (ADS)

    Kim, Byungki; Kwak, Byung Hyung; Jamil, Faize

    2008-08-01

    This paper presents a micromachined silicon membrane type AFM tip designed to move nearly 1µm by electrostatic force. Since the tip can be vibrated in small amplitude with AC voltage input and can be displaced up to 1μm by DC voltage input, an additional piezo actuator is not required for scanning of submicron features. The micromachined membrane tips are designed to have 100 kHz ~ 1 MHz resonant frequency. Displacement of the membrane tip is measured by an optical interferometer using a micromachined diffraction grating on a quartz wafer which is positioned behind the membrane tip.

  4. Sharp high-aspect-ratio AFM tips fabricated by a combination of deep reactive ion etching and focused ion beam techniques.

    PubMed

    Caballero, David; Villanueva, Guillermo; Plaza, Jose Antonio; Mills, Christopher A; Samitier, Josep; Errachid, Abdelhamid

    2010-01-01

    The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 degrees or nanoscaled structures, standard silicon atomic force microscopy (AFM) tips do not provide satisfactory results. We have combined deep reactive ion etching (DRIE) and focused ion beam (FIB) lithography techniques in order to produce probes with sharp rocket-shaped silicon AFM tips for high resolution imaging. The cantilevers were shaped and the bulk micromachining was performed using the same DRIE equipment. To improve the tip aspect ratio we used FIB nanolithography technique. The tips were tested on narrow silicon trenches and over biological samples showing a better resolution when compared with standard AFM tips, which enables nanocharacterization and nanometrology of high-aspect-ratio structures and nanoscaled biological elements to be completed, and provides an alternative to commercial high aspect ratio AFM tips.

  5. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy.

    PubMed

    Schürmann, G; Noell, W; Staufer, U; de Rooij, N F; Eckert, R; Freyland, J M; Heinzelmann, H

    2001-10-01

    A cantilever-based probe is introduced for use in scanning near-field optical microscopy (SNOM) combined with scanning atomic-force microscopy (AFM). The probes consist of silicon cantilevers with integrated 25-mum-high fused-silica tips. The probes are batch fabricated by microfabrication technology. Transmission electron microscopy reveals that the transparent quartz tips are completely covered with an opaque aluminum layer before the SNOM measurement. Static and dynamic AFM imaging was performed. SNOM imaging in transmission mode of single fluorescent molecules shows an optical resolution better than 32 nm.

  6. GaN nanowire tip for high aspect ratio nano-scale AFM metrology (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Behzadirad, Mahmoud; Dawson, Noel; Nami, Mohsen; Rishinaramangalam, Ashwin K.; Feezell, Daniel F.; Busani, Tito L.

    2016-09-01

    In this study we introduce Gallium Nitride (GaN) nanowire (NW) as high aspect ratio tip with excellent durability for nano-scale metrology. GaN NWs have superior mechanical property and young modulus compare to commercial Si and Carbon tips which results in having less bending issue during measurement. The GaN NWs are prepared via two different methods: i) Catalyst-free selected area growth, using Metal Organic Chemical Vapor Deposition (MOCVD), ii) top-down approach by employing Au nanoparticles as the mask material in dry-etch process. To achieve small diameter tips, the semipolar planes of the NWs grown by MOCVD are etched using AZ400k. The diameter of the NWs fabricated using the top down process is controlled by using different size of nanoparticles and by Inductively Coupled Plasma etching. NWs with various diameters were manipulated on Si cantilevers using Focus Ion Beam (FIB) to make tips for AFM measurement. A Si (110) substrate containing nano-scale grooves with vertical 900 walls were used as a sample for inspection. AFM measurements were carried out in tapping modes for both types of nanowires (top-down and bottom-up grown nanowires) and results are compared with conventional Si and carbon nanotube tips. It is shown our fabricated tips are robust and have improved edge resolution over conventional Si tips. GaN tips made with NW's fabricated using our top down method are also shown to retain the gold nanoparticle at tip, which showed enhanced field effects in Raman spectroscopy.

  7. Theoretical modelling of AFM for bimetallic tip-substrate interactions

    NASA Technical Reports Server (NTRS)

    Bozzolo, Guillermo; Ferrante, John

    1991-01-01

    Recently, a new technique for calculating the defect energetics of alloys based on Equivalent Crystal Theory was developed. This new technique successfully predicts the bulk properties for binary alloys as well as segregation energies in the dilute limit. The authors apply this limit for the calculation of energy and force as a function of separation of an atomic force microscope (AFM) tip and substrate. The study was done for different combinations of tip and sample materials. The validity of the universality discovered for the same metal interfaces is examined for the case of different metal interactions.

  8. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    PubMed Central

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-01-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air. PMID:26574164

  9. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

    NASA Astrophysics Data System (ADS)

    Dukic, Maja; Adams, Jonathan D.; Fantner, Georg E.

    2015-11-01

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air.

  10. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging.

    PubMed

    Dukic, Maja; Adams, Jonathan D; Fantner, Georg E

    2015-11-17

    Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD in readout size and the ability to image in light-sensitive or opaque environments, but traditionally have worse noise performance. Miniaturisation of cantilevers, however, brings much greater benefit to the noise performance of piezoresistive sensing than to OBD. In this paper, we show both theoretically and experimentally that by using small-sized piezoresistive cantilevers, the AFM imaging noise equal or lower than the OBD readout noise is feasible, at standard scanning speeds and power dissipation. We demonstrate that with both readouts we achieve a system noise of ≈0.3 Å at 20 kHz measurement bandwidth. Finally, we show that small-sized piezoresistive cantilevers are well suited for piezoresistive nanoscale imaging of biological and solid state samples in air.

  11. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    NASA Technical Reports Server (NTRS)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  12. Study of the sensitivity and resonant frequency of the torsional modes of an AFM cantilever with a sidewall probe based on a nonlocal elasticity theory.

    PubMed

    Abbasi, Mohammad; Karami Mohammadi, Ardeshir

    2015-05-01

    A relationship based on a nonlocal elasticity theory is developed to investigate the torsional sensitivity and resonant frequency of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever and a vertical extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidewalls of microstructures. First, the governing differential equations of motion and boundary conditions for dynamic analysis are obtained by a combination of the basic equations of nonlocal elasticity theory and Hamilton's principle. Afterward, a closed-form expression for the sensitivity of vibration modes has been obtained using the relationship between the resonant frequency and contact stiffness of cantilever and sample. These analysis accounts for a better representation of the torsional behavior of an AFM with sidewall probe where the small-scale effect are significant. The results of the proposed model are compared with those of classical beam theory. The results show that the sensitivities and resonant frequencies of ACP predicted by the nonlocal elasticity theory are smaller than those obtained by the classical beam theory.

  13. Nanogap based graphene coated AFM tips with high spatial resolution, conductivity and durability.

    PubMed

    Lanza, Mario; Gao, Teng; Yin, Zixuan; Zhang, Yanfeng; Liu, Zhongfan; Tong, Yuzhen; Shen, Ziyong; Duan, Huiling

    2013-11-21

    After one decade of analyzing the intrinsic properties of graphene, interest into the development of graphene-based devices and micro electromechanical systems is increasing. Here, we fabricate graphene-coated atomic force microscope tips by growing the graphene on copper foil and transferring it onto the apex of a commercially available AFM tip. The resulting tip exhibits surprising enhanced resolution in nanoscale electrical measurements. By means of topographic AFM maps and statistical analyses we determine that this superior performance may be related to the presence of a nanogap between the graphene and the tip apex, which reduces the tip radius and tip-sample contact area. In addition, the graphene-coated tips show a low tip-sample interaction, high conductivity and long life times. The novel fabrication-friendly tip could improve the quality and reliability of AFM experiments, while reducing the cost of AFM-based research.

  14. AFM tip effect on a thin liquid film.

    PubMed

    Ledesma-Alonso, R; Legendre, D; Tordjeman, Ph

    2013-06-25

    We study the interaction between an AFM probe and a liquid film deposited over a flat substrate. We investigate the effects of the physical and geometrical parameters, with a special focus on the film thickness E, the probe radius R, and the distance D between the probe and the free surface. Deformation profiles have been calculated from the numerical simulations of the Young-Laplace equation by taking into account the probe/liquid and the liquid/substrate interactions, characterized by the Hamaker constants, Hpl and Hls. We demonstrate that the deformation of a shallow film is determined by a particular characteristic length λF = (2πγE(4)/Hls)(1/2), resulting from the balance between the capillary force (γ is the surface tension) and the van der Waals liquid/substrate attraction. For the case of a bulk liquid, the extent of the interface deformation is simply controlled by the capillary length λC = (γ/Δρg)(1/2). These trends point out two asymptotic regimes, which in turn are bounded by two characteristic film thicknesses Eg = (Hls/2πΔρg)(1/4) and Eγ = (R(2)Hls/2πγ)(1/4). For E > Eg, the bulk behavior is recovered, and for E < Eγ, we show the existence of a particular shallow film regime in which a localized tip effect is observed. This tip effect is characterized by the small magnitude of the deformation and an important restriction of its radial extent λF localized below the probe. In addition, we have found that the film thickness has a significant effect on the threshold separation distance Dmin below which the irreversible jump-to-contact process occurs: Dmin is probe radius-dependent for the bulk whereas it is film-thickness-dependent for shallow films. These results have an important impact on the optimal AFM scanning conditions.

  15. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew; Eardley, Matthew; Kitching, John

    2015-05-01

    We report the resonant coupling of laser cooled trapped Rb atoms to a micro-cantilever with a magnetic tip. An atom chip is used to trap, cool, and transport the atoms to the tip of the cantilever. The capacitively-driven cantilever oscillation produces Zeeman state transitions which result in a loss of population in the trap. In a suitably scaled setup, mechanical resonators could be used to probe and manipulate atomic spins with nanometer spatial resolution and single-spin sensitivity; this technique may enable new approaches in neutral-atom quantum computation, quantum simulation, or precision sensing.

  16. Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup

    PubMed Central

    Leitner, Michael; Fantner, Georg E.; Fantner, Ernest J.; Ivanova, Katerina; Ivanov, Tzvetan; Rangelow, Ivo; Ebner, Andreas; Rangl, Martina; Tang, Jilin; Hinterdorfer, Peter

    2012-01-01

    In this study, we demonstrate the increased performance in speed and sensitivity achieved by the use of small AFM cantilevers on a standard AFM system. For this, small rectangular silicon oxynitride cantilevers were utilized to arrive at faster atomic force microscopy (AFM) imaging times and more sensitive molecular recognition force spectroscopy (MRFS) experiments. The cantilevers we used had lengths between 13 and 46 μm, a width of about 11 μm, and a thickness between 150 and 600 nm. They were coated with chromium and gold on the backside for a better laser reflection. We characterized these small cantilevers through their frequency spectrum and with electron microscopy. Due to their small size and high resonance frequency we were able to increase the imaging speed by a factor of 10 without any loss in resolution for images from several μm scansize down to the nanometer scale. This was shown on bacterial surface layers (s-layer) with tapping mode under aqueous, near physiological conditions and on nuclear membranes in contact mode in ambient environment. In addition, we showed that single molecular forces can be measured with an up to 5 times higher force sensitivity in comparison to conventional cantilevers with similar spring constants. PMID:22721963

  17. Attaching single biomolecules selectively to the apex of AFM tips for measuring specific interactions.

    PubMed

    Gu, Jianhua; Xiao, Zhongdang; Yam, Chi-Ming; Qin, Guoting; Deluge, Maxence; Boutet, Sabine; Cai, Chengzhi

    2005-11-01

    We present a general approach for preparing well-defined AFM tips for probing single target molecules. We demonstrated that carboxylic acid groups could be generated by electrochemical oxidation selectively at the apex of an AFM tip that is coated with a monolayer of oligo(ethylene glycol) derivatives for resisting nonspecific interactions. These carboxylic acid groups were used as handles to tether only one ligand molecule, such as biotin, to the tip apex for measurement of specific interactions with biomolecules.

  18. Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging.

    PubMed

    Ma, Xuezhi; Zhu, Yangzhi; Kim, Sanggon; Liu, Qiushi; Byrley, Peter; Wei, Yang; Zhang, Jin; Jiang, Kaili; Fan, Shoushan; Yan, Ruoxue; Liu, Ming

    2016-11-09

    Despite many efforts to fabricate high-aspect-ratio atomic force microscopy (HAR-AFM) probes for high-fidelity, high-resolution topographical imaging of three-dimensional (3D) nanostructured surfaces, current HAR probes still suffer from unsatisfactory performance, low wear-resistivity, and extravagant prices. The primary objective of this work is to demonstrate a novel design of a high-resolution (HR) HAR AFM probe, which is fabricated through a reliable, cost-efficient benchtop process to precisely implant a single ultrasharp metallic nanowire on a standard AFM cantilever probe. The force-displacement curve indicated that the HAR-HR probe is robust against buckling and bending up to 150 nN. The probes were tested on polymer trenches, showing a much better image fidelity when compared with standard silicon tips. The lateral resolution, when scanning a rough metal thin film and single-walled carbon nanotubes (SW-CNTs), was found to be better than 8 nm. Finally, stable imaging quality in tapping mode was demonstrated for at least 15 continuous scans indicating high resistance to wear. These results demonstrate a reliable benchtop fabrication technique toward metallic HAR-HR AFM probes with performance parallel or exceeding that of commercial HAR probes, yet at a fraction of their cost.

  19. Measurement of interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} and immobilized vitronectin on the cantilever tip

    SciTech Connect

    Lee, Minsu; Yang, Hyun-Kyu; Park, Keun-Hyung; Kang, Dong-Ku; Chang, Soo-Ik Kang, In-Cheol

    2007-11-03

    Protein nanoarrays containing integrin {alpha}{sub v}{beta}{sub 3} or BSA were fabricated on ProLinker{sup TM}-coated Au surface by dip-pen nanolithography (DPN). An atomic force microscope (AFM) tip coated with ProLinker{sup TM} was modified by vitronectin. We measured the interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} or BSA and immobilized vitronectin on the cantilever tip by employing tethering-unbinding method. The unbinding force between integrin {alpha}{sub v}{beta}{sub 3} and vitronectin (1087 {+-} 62 pN) was much higher than that of between BSA and vitronectin (643 {+-} 74 pN). These results demonstrate that one can distinguish a specific protein interaction from non-specific interactions by means of force measurement on the molecular interactions between the nanoarrayed protein and its interacting protein on the AFM tip.

  20. Tip Characterization Method using Multi-feature Characterizer for CD-AFM

    PubMed Central

    Orji, Ndubuisi G.; Itoh, Hiroshi; Wang, Chumei; Dixson, Ronald G.; Walecki, Peter S.; Schmidt, Sebastian W.; Irmer, Bernd

    2016-01-01

    In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric dilation is more pronounced when measuring features with high aspect ratios, and makes it difficult to obtain absolute dimensions. In order to accurately measure nanoscale features using an AFM, the tip dimensions should be known with a high degree of precision. We evaluate a new AFM tip characterizer, and apply it to critical dimension AFM (CD-AFM) tips used for high aspect ratio features. The characterizer is made up of comb-shaped lines and spaces, and includes a series of gratings that could be used as an integrated nanoscale length reference. We also demonstrate a simulation method that could be used to specify what range of tip sizes and shapes the characterizer can measure. Our experiments show that for non re-entrant features, the results obtained with this characterizer are consistent to 1 nm with the results obtained by using widely accepted but slower methods that are common practice in CD-AFM metrology. A validation of the integrated length standard using displacement interferometry indicates a uniformity of better than 0.75%, suggesting that the sample could be used as highly accurate and SI traceable lateral scale for the whole evaluation process. PMID:26720439

  1. AFM tip characterization by using FFT filtered images of step structures.

    PubMed

    Yan, Yongda; Xue, Bo; Hu, Zhenjiang; Zhao, Xuesen

    2016-01-01

    The measurement resolution of an atomic force microscope (AFM) is largely dependent on the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the value of the tip radius is needed in calculations. As such, estimation of the tip radius is important for analyzing results taken using an AFM. In this study, a geometrical model created by scanning a step structure with an AFM tip was developed. The tip was assumed to have a hemispherical cone shape. Profiles simulated by tips with different scanning radii were calculated by fast Fourier transform (FFT). By analyzing the influence of tip radius variation on the spectra of simulated profiles, it was found that low-frequency harmonics were more susceptible, and that the relationship between the tip radius and the low-frequency harmonic amplitude of the step structure varied monotonically. Based on this regularity, we developed a new method to characterize the radius of the hemispherical tip. The tip radii estimated with this approach were comparable to the results obtained using scanning electron microscope imaging and blind reconstruction methods.

  2. DNA-coated AFM cantilevers for the investigation of cell adhesion and the patterning of live cells

    SciTech Connect

    Hsiao, Sonny C.; Crow, Ailey K.; Lam, Wilbur A.; Bertozzi, Carolyn R.; Fletcher, Daniel A.; Francis, Matthew B.

    2008-08-01

    Measurement of receptor adhesion strength requires the precise manipulation of single cells on a contact surface. To attach live cells to a moveable probe, DNA sequences complementary to strands displayed on the plasma membrane are introduced onto AFM cantilevers (see picture, bp=base pairs). The strength of the resulting linkages can be tuned by varying the length of DNA strands, allowing for controlled transport of the cells.

  3. Study of mechanical behavior of AFM silicon tips under mechanical load

    NASA Astrophysics Data System (ADS)

    Kopycinska-Mueller, M.; Gluch, J.; Köhler, B.

    2016-11-01

    In this paper we address critical issues concerning calibration of AFM based methods used for nanoscale mechanical characterization of materials. It has been shown that calibration approaches based on macroscopic models for contact mechanics may yield excellent results in terms of the indentation modulus of the sample, but fail to provide a comprehensive and actual information concerning the tip-sample contact radius or the mechanical properties of the tip. Explanations for the severely reduced indentation modulus of the tip included the inadequacies of the models used for calculations of the tip-sample contact stiffness, discrepancies in the actual and ideal shape of the tip, presence of the amorphous silicon phase within the silicon tip, as well as negligence of the actual size of the stress field created in the tip during elastic interactions. To clarify these issues, we investigated the influence of the mechanical load applied to four AFM silicon tips on their crystalline state by exposing them to systematically increasing loads, evaluating the character of the tip-sample interactions via the load-unload stiffness curves, and assessing the state of the tips from HR-TEM images. The results presented in this paper were obtained in a series of relatively simple and basic atomic force acoustic microscopy (AFAM) experiments. The novel combination of TEM imaging of the AFM tips with the analysis of the load-unload stiffness curves gave us a detailed insight into their mechanical behavior under load conditions. We were able to identify the limits for the elastic interactions, as well as the hallmarks for phase transformation and dislocation formation and movement. The comparison of the physical dimensions of the AFM tips, geometry parameters determined from the values of the contact stiffness, and the information on the crystalline state of the tips allowed us a better understanding of the nanoscale contact.

  4. Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End

    PubMed Central

    Gonzalez, Laura; Martínez-Martín, David; Otero, Jorge; de Pablo, Pedro José; Puig-Vidal, Manel; Gómez-Herrero, Julio

    2015-01-01

    The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. PMID:25594596

  5. Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end.

    PubMed

    Gonzalez, Laura; Martínez-Martín, David; Otero, Jorge; de Pablo, Pedro José; Puig-Vidal, Manel; Gómez-Herrero, Julio

    2015-01-14

    The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.

  6. Resonant interaction of trapped cold atoms with a magnetic cantilever tip

    NASA Astrophysics Data System (ADS)

    Montoya, Cris; Valencia, Jose; Geraci, Andrew A.; Eardley, Matthew; Moreland, John; Hollberg, Leo; Kitching, John

    2015-06-01

    Magnetic resonance in an ensemble of laser-cooled trapped Rb atoms is excited using a microcantilever with a magnetic tip. The cantilever is mounted on a multilayer chip designed to capture, cool, and magnetically transport cold atoms. The coupling is observed by measuring the loss from a magnetic trap as the oscillating cantilever induces Zeeman-state transitions in the atoms. Interfacing cold atoms with mechanical devices could enable probing and manipulating atomic spins with nanometer spatial resolution and single-spin sensitivity, leading to new capabilities in quantum computation, quantum simulation, and precision sensing.

  7. Large deflections of a cantilever beam under arbitrarily directed tip load

    NASA Technical Reports Server (NTRS)

    Mccomb, H. E., Jr.

    1985-01-01

    The nonlinear beam equation was integrated numerically in a direct fashion to obtain results for large deflections of cantilevers under tip loads of arbitrary direction. A short BASIC computer program for performing this integration is presented. Results for selected load cases are presented. The numerical process is performed rapidly on a modern microcomputer, and comparisons with results from closed form solutions show that the process is accurate.

  8. Comparing AFM cantilever stiffness measured using the thermal vibration and the improved thermal vibration methods with that of an SI traceable method based on MEMS

    NASA Astrophysics Data System (ADS)

    Brand, Uwe; Gao, Sai; Engl, Wolfgang; Sulzbach, Thomas; Stahl, Stefan W.; Milles, Lukas F.; Nesterov, Vladimir; Li, Zhi

    2017-03-01

    PTB has developed a new contact based method for the traceable calibration of the normal stiffness of AFM cantilevers in the range from 0.03 N m‑1 to 300 N m‑1 to the SI units based on micro-electro-mechanical system (MEMS) actuators. This method is evaluated by comparing the measured cantilever stiffness with that measured by PTB’s new primary nanonewton force facility and by PTB’s microforce measuring device. The MEMS system was used to calibrate the stiffness of cantilevers in two case studies. One set of cantilevers for applications in biophysics was calibrated using the well-known thermal vibration method and the second set of cantilevers was calibrated by a cantilever manufacturer who applied an improved thermal vibration method based on calibrated reference cantilevers for the cantilever stiffness calibration. The comparison revealed a stiffness deviation of  +7.7% for the cantilevers calibrated using the thermal vibration method and a deviation of  +6.9% for the stiffnesses of the cantilevers calibrated using the improved thermal vibration method.

  9. Investigation of Molecular Interactions between AFM-Tip and Thiol Films

    NASA Astrophysics Data System (ADS)

    Touhami, Ahmed; Moore, Justin; Lee, T. Randall

    Among various self-assembly processes, the formation of a self-assembled monolayer (SAM) is one of the most elegant ways for making an organic film with specific surface properties. Recently, much effort has been devoted in using AFM-based single-molecule force spectroscopy (SMFS) to understanding the formation of alkanethiol SAMs on gold surfaces. Investigating the factors that affect the AFM tip-SAMs interactions is necessary to clarify the controversial results of these studies. Here, we investigated the interactions between bare AFM-tips and several SAMs thiols-gold surfaces under controlled humidity conditions. Our results demonstrate that the Tip-SAM interactions can be used to precisely determine the length of the thiol chains, the adhesion force between thiols head groups and the AFM tip, and the strength of the thiol-gold contact. Our findings on the dynamics and the structure of the SAMs of alkanethiols on gold are useful for detail understanding of the thermodynamics, kinetics and mechanisms of SAM technology assembly. NSF.

  10. Versatile method for AFM-tip functionalization with biomolecules: fishing a ligand by means of an in situ click reaction.

    PubMed

    Kumar, Rakesh; Ramakrishna, Shivaprakash N; Naik, Vikrant V; Chu, Zonglin; Drew, Michael E; Spencer, Nicholas D; Yamakoshi, Yoko

    2015-04-21

    A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions.

  11. Rapid serial prototyping of magnet-tipped attonewton-sensitivity cantilevers by focused ion beam manipulation1

    PubMed Central

    Longenecker, Jonilyn G.; Moore, Eric W.; Marohn, John A.

    2011-01-01

    The authors report a method for rapidly prototyping attonewton-sensitivity cantilevers with custom-fabricated tips and illustrate the method by preparing tips consisting of a magnetic nanorod overhanging the leading edge of the cantilevers. Micron-long nickel nanorods with widths of 120–220 nm were fabricated on silicon chips by electron beam lithography, deposition, and lift-off. Each silicon chip, with its integral nanomagnet, was attached serially to a custom-fabricated attonewton-sensitivity cantilever using focused ion beam manipulation. The magnetic nanorod tips were prepared with and without an alumina capping layer, and the minimum detectable force and tip magnetic moment of the resulting cantilevers was characterized by cantilever magnetometry. The results indicate that this serial but high-yield approach is an effective way to rapidly prepare and characterize magnetic tips for the proposed single-electron-spin and single-proton magnetic resonance imaging experiments. The approach also represents a versatile route for affixing essentially any vacuum-compatible sample to the leading edge of an attonewton-sensitivity cantilever. PMID:23028212

  12. Transverse vibration and buckling of a cantilevered beam with tip body under constant axial base acceleration

    NASA Technical Reports Server (NTRS)

    Storch, J.; Gates, S.

    1983-01-01

    The planar transverse bending behavior of a uniform cantilevered beam with rigid tip body subject to constant axial base acceleration was analyzed. The beam is inextensible and capable of small elastic transverse bending deformations only. Two classes of tip bodies are recognized: (1) mass centers located along the beam tip tangent line; and (2) mass centers with arbitrary offset towards the beam attachment point. The steady state response is studied for the beam end condition cases: free, tip mass, tip body with restricted mass center offset, and tip body with arbitrary mass center offset. The first three cases constitute classical Euler buckling problems, and the characteristic equation for the critical loads/accelerations are determined. For the last case a unique steady state solution exists. The free vibration response is examined for the two classes of tip body. The characteristic equation, eigenfunctions and their orthogonality properties are obtained for the case of restricted mass center offset. The vibration problem is nonhomogeneous for the case of arbitrary mass center offset. The exact solution is obtained as a sum of the steady state solution and a superposition of simple harmonic motions.

  13. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  14. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.

    PubMed

    Long, Christian J; Cannara, Rachel J

    2015-07-01

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  15. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam.

    PubMed

    Wagner, R; Woehl, T J; Keller, R R; Killgore, J P

    2016-07-25

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  16. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Wagner, R.; Woehl, T. J.; Keller, R. R.; Killgore, J. P.

    2016-07-01

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  17. Mechanism of high-resolution STM, AFM and IETS-STM imaging with functionalized tips

    NASA Astrophysics Data System (ADS)

    Temirov, R.; Hapala, P.; Tautz, F. S.; Jelinek, P.

    2015-03-01

    High-resolution AFM and STM with functionalized tips is well established, but a detailed understanding of the image mechanism is still missing. Moreover, recently this family of imaging techniques has been complemented by a method based on inelastic electron tunneling spectroscopy. Here we present a comprehensive mechanical and transport simulation model that explains essentially all image features in functionalized tip STM, AFM and IETS-STM. Important aspects of the mechanism are: (i) Images are dominantly determined by Pauli repulsion, (ii) in STM and IETS STM this force signal is transduced into an elastic or inelastic conductance signal, (iii) probe particle relaxation leads to image sharpening, (iv) the apparent imaging of hydrogen bonds can be explained by a relaxation effect, and (v) electrostatic forces may also influence the image contrast.

  18. Study on effects of scan parameters on the image quality and tip wear in AFM tapping mode.

    PubMed

    Xue, Bo; Yan, Yongda; Hu, Zhenjiang; Zhao, Xuesen

    2014-01-01

    Due to the tip-sample interaction which is the measurement principle of Atomic Force Microscope (AFM), tip wear constantly occurs during scanning. The blunt tip caused by the wear process makes more tip geometry information involved in the image, and correspondingly it increases the measurement error. In the present study, the scan parameters of AFM in tapping mode which affect the wear of single crystal silicon tips, such as the approaching rate, the scan rate, the scan amplitude, and the integral gain are investigated. By proposing a parameter reflecting the imaging quality, the tip state tracing the sample surface is evaluated quantitatively. The influences of scan parameters on this imaging quality parameter are obtained by experiments. Finally, in order to achieve the perfect images with little tip wear influence, tip wear experiments are carried out and then the optimal parameter settings which can lighten the tip wear are obtained.

  19. AFM fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe

    SciTech Connect

    Van Berkel, Gary J.

    2015-06-23

    An electrospray system comprises a liquid extraction surface sampling probe. The probe comprises a probe body having a liquid inlet and a liquid outlet, and having a liquid extraction tip. A solvent delivery conduit is provided for receiving solvent liquid from the liquid inlet and delivering the solvent liquid to the liquid extraction tip. An open liquid extraction channel extends across an exterior surface of the probe body from the liquid extraction tip to the liquid outlet. An electrospray emitter tip is in liquid communication with the liquid outlet of the liquid extraction surface sampling probe. A system for analyzing samples, a liquid junction surface sampling system, and a method of analyzing samples are also disclosed.

  20. A study of water droplet between an AFM tip and a substrate using dissipative particle dynamics

    NASA Astrophysics Data System (ADS)

    Pal, Souvik; Lan, Chuanjin; Li, Zhen; Hirleman, E. Daniel; Ma, Yanbao

    2014-11-01

    Formation of a water droplet between a sharp AFM tip and a substrate due to capillary condensation affects the tip-substrate interaction. As a consequence, AFM measurements lose precision and often produce incorrect sample topology. Understanding the physics of liquid bridges is also important in the field of Dip-pen nanolithography (DPN). Significant research is being carried out to understand the mechanics of the formation of the liquid bridge and its dependence of surface properties, ambient conditions etc. The in-between length scale, i.e., mesoscale (~100 nm) associated with this phenomenon presents a steep challenge for experimental measurements. In addition, molecular dynamics (MD) can be computationally prohibitive to model the entire system, especially over microseconds to seconds. Theoretical analysis using Young Laplace equation has so far provided some qualitative insights only. We study this system using Dissipative Particle Dynamics (DPD) which is a simulation technique suitable for describing mesoscopic hydrodynamic behavior of fluids. In this work, we carry out simulations to improve understanding of the process of formation of the meniscus, the mechanics of manipulation and control of its shape, and better estimation of capillary forces. The knowledge gained through our study will help in correcting the AFM measurements affected by capillary condensation. Moreover, it will improve understanding of more accurate droplet manipulation in DPN.

  1. Exploring electron transport through organic monolayers using conductive tip AFM techniques

    NASA Astrophysics Data System (ADS)

    Scaini, Denis; Castronovo, Matteo; Dell'Angela, Martina; Hudej, Robert; Casalis, Loredana; Scoles, Giacinto

    2006-03-01

    We follow an alternative approach to the study of Metal-molecule-Metal junctions that uses a combination of two atomic force microscopy (AFM) techniques. We use Nanografting to build a nanopatch of the molecules of interest and a second made of a reference molecule into a hosting self assembled monolayer (SAM) typically made of alkanethiols. After the tip is changed to a conductive one CT-AFM is used to characterized the whole system recording, at the same time, the system topography. Some of the advantages of this approach are the possibility to build and study a wide range of different M-m-M junctions and the in-situ control of the quality of the monolayers and patches. Results will be presented on saturated and unsaturated thiols self-assembled and nanografted on Au(111) surfaces. The results will be compared with those obtained by Liang and Scoles at Princeton using similar techniques.

  2. Versatile method for AFM-tip functionalization with biomolecules: fishing a ligand by means of an in situ click reaction

    NASA Astrophysics Data System (ADS)

    Kumar, Rakesh; Ramakrishna, Shivaprakash N.; Naik, Vikrant V.; Chu, Zonglin; Drew, Michael E.; Spencer, Nicholas D.; Yamakoshi, Yoko

    2015-04-01

    A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions.A facile and universal method for the functionalization of an AFM tip has been developed for chemical force spectroscopy (CFS) studies of intermolecular interactions of biomolecules. A click reaction between tripod-acetylene and an azide-linker-ligand molecule was successfully carried out on the AFM tip surface and used for the CFS study of ligand-receptor interactions. Electronic supplementary information (ESI) available: Experimental details with synthesis and characterization of compounds. Procedures for modifications of Au surfaces and AFM tips. AFM images and full PM-IRRAS spectra of modified surfaces. Detailed procedure for QCM measurement. A table showing ligand-receptor interaction probability. NMR, IR and MS charts. See DOI: 10.1039/c5nr01495f

  3. High throughput nanofabrication of silicon nanowire and carbon nanotube tips on AFM probes by stencil-deposited catalysts.

    PubMed

    Engstrom, Daniel S; Savu, Veronica; Zhu, Xueni; Bu, Ian Y Y; Milne, William I; Brugger, Juergen; Boggild, Peter

    2011-04-13

    A new and versatile technique for the wafer scale nanofabrication of silicon nanowire (SiNW) and multiwalled carbon nanotube (MWNT) tips on atomic force microscope (AFM) probes is presented. Catalyst material for the SiNW and MWNT growth was deposited on prefabricated AFM probes using aligned wafer scale nanostencil lithography. Individual vertical SiNWs were grown epitaxially by a catalytic vapor-liquid-solid (VLS) process and MWNTs were grown by a plasma-enhanced chemical vapor (PECVD) process on the AFM probes. The AFM probes were tested for imaging micrometers-deep trenches, where they demonstrated a significantly better performance than commercial high aspect ratio tips. Our method demonstrates a reliable and cost-efficient route toward wafer scale manufacturing of SiNW and MWNT AFM probes.

  4. Observation of Spin-flop Transition in Antiferromagnetic Organic Molecular Conductors using AFM Micro-cantilever

    NASA Astrophysics Data System (ADS)

    Tokumoto, Madoka; Otsuka, Takeo; Kobayashi, Akiko

    2005-03-01

    A series of (BETS)2Fe1-xGaxCl1-yBry salts is a good candidate for a systematic study of π-d interaction between the conduction electrons and local magnetic moments in organic conductors. Some of them show antiferromagnetic ground state at low temperatures. A torque magnetometry is useful for precise determination of the easy axis as well as the spin-flop field. In this work we will report on the measurements of spin-flop transitions in antiferromagnetic organic molecular conductors including λ-(BETS)2FeCl4[1], using a commercial self-sensing piezo-resistive microcantilever for Atomic Force Microscopy (AFM) developed by Seiko Instruments Inc. We have succeeded in observation of spin-flop transitions of tiny single crystals including λ-(BETS)2FeCl4 as small as less than 1μg[2]. The results are consistent with the capacitive magnetic torque study[3]. [1] M. Tokumoto et al. Synth. Metals 86, 2161 (1997). [2] M. Tokumoto et al., ICMM2004, Polyhedron in press. [3] T. Sasaki et al., Synth. Metals 120, 759 (2001).

  5. Reconstructing the distributed force on an atomic force microscope cantilever.

    PubMed

    Wagner, Ryan; Killgore, Jason

    2017-03-10

    A methodology is developed to reconstruct the force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting Bernoulli-Euler beam theory such that the force on the cantilever is approximated as a linear superposition of the theoretical cantilever eigenmodes. The weighting factors in this summation are calculated from the amplitude and phase measured along the length of the cantilever. The accuracy of the force reconstruction is shown to depend on the frequency at which the measurement is performed, the number of discrete points measured along the length of the cantilever, and the signal-to-noise ratio of the measured signal. In contrast to other AFM force reconstruction techniques, this method can reconstruct the distribution of force applied over the length of the AFM cantilever. However, this method performs poorly for localized forces applied to the cantilever, such as is typical of most tip-sample interaction forces. Proof of concept experiments are performed on an electrostatically excited cantilever and the expected force distribution is recovered. This force reconstruction technique offers previously unavailable insight into the distributed forces experienced by an AFM cantilever.

  6. A dynamic model of a cantilever beam with a closed, embedded horizontal crack including local flexibilities at crack tips

    NASA Astrophysics Data System (ADS)

    Liu, J.; Zhu, W. D.; Charalambides, P. G.; Shao, Y. M.; Xu, Y. F.; Fang, X. M.

    2016-11-01

    As one of major failure modes of mechanical structures subjected to periodic loads, embedded cracks due to fatigue can cause catastrophic failure of machineries. Understanding the dynamic characteristics of a structure with an embedded crack is helpful for early crack detection and diagnosis. In this work, a new three-segment beam model with local flexibilities at crack tips is developed to investigate the vibration of a cantilever beam with a closed, fully embedded horizontal crack, which is assumed to be not located at its clamped or free end or distributed near its top or bottom side. The three-segment beam model is assumed to be a linear elastic system, and it does not account for the nonlinear crack closure effect; the top and bottom segments always stay in contact at their interface during the beam vibration. It can model the effects of local deformations in the vicinity of the crack tips, which cannot be captured by previous methods in the literature. The middle segment of the beam containing the crack is modeled by a mechanically consistent, reduced bending moment. Each beam segment is assumed to be an Euler-Bernoulli beam, and the compliances at the crack tips are analytically determined using a J-integral approach and verified using commercial finite element software. Using compatibility conditions at the crack tips and the transfer matrix method, the nature frequencies and mode shapes of the cracked cantilever beam are obtained. The three-segment beam model is used to investigate the effects of local flexibilities at crack tips on the first three natural frequencies and mode shapes of the cracked cantilever beam. A stationary wavelet transform (SWT) method is used to process the mode shapes of the cracked cantilever beam; jumps in single-level SWT decomposition detail coefficients can be used to identify the length and location of an embedded horizontal crack.

  7. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions.

    PubMed

    Borysov, Stanislav S; Forchheimer, Daniel; Haviland, David B

    2014-01-01

    We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

  8. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  9. Tip convolution on HOPG surfaces measured in AM-AFM and interpreted using a combined experimental and simulation approach

    NASA Astrophysics Data System (ADS)

    Hu, Xiaoli; Chan, Nicholas; Martini, Ashlie; Egberts, Philip

    2017-01-01

    Amplitude modulated atomic force microscopy (AM-AFM) was used to examine the influence of the size of the AFM tip apex on the measured surface topography of single highly oriented pyrolytic graphite (HOPG) atomic steps. Experimental measurements were complemented by molecular dynamics simulations of AM-AFM and the results from both were evaluated by comparison of the measured or simulated width of the topography at the step to that predicted using simple rigid-body geometry. The results showed that the step width, which is a reflection of the resolution of the measurement, increased with tip size, as expected, but also that the difference between the measured/simulated step width and the geometric calculation was tip size dependent. The simulations suggested that this may be due to the deformation of the bodies and the effect of that deformation on the interaction force and oscillation amplitude. Overall, this study showed that the resolution of AM-AFM measurements of atomic steps can be correlated to tip size and that this relationship is affected by the deformation of the system.

  10. Cantilever arrays with self-aligned nanotips of uniform height

    NASA Astrophysics Data System (ADS)

    Koelmans, W. W.; Peters, T.; Berenschot, E.; de Boer, M. J.; Siekman, M. H.; Abelmann, L.

    2012-04-01

    Cantilever arrays are employed to increase the throughput of imaging and manipulation at the nanoscale. We present a fabrication process to construct cantilever arrays with nanotips that show a uniform tip-sample distance. Such uniformity is crucial, because in many applications the cantilevers do not feature individual tip-sample spacing control. Uniform cantilever arrays lead to very similar tip-sample interaction within an array, enable non-contact modes for arrays and give better control over the load force in contact modes. The developed process flow uses a single mask to define both tips and cantilevers. An additional mask is required for the back side etch. The tips are self-aligned in the convex corner at the free end of each cantilever. Although we use standard optical contact lithography, we show that the convex corner can be sharpened to a nanometre scale radius by an isotropic underetch step. The process is robust and wafer-scale. The resonance frequencies of the cantilevers within an array are shown to be highly uniform with a relative standard error of 0.26% or lower. The tip-sample distance within an array of up to ten cantilevers is measured to have a standard error around 10 nm. An imaging demonstration using the AFM shows that all cantilevers in the array have a sharp tip with a radius below 10 nm. The process flow for the cantilever arrays finds application in probe-based nanolithography, probe-based data storage, nanomanufacturing and parallel scanning probe microscopy.

  11. Improved atomic force microscopy cantilever performance by partial reflective coating

    PubMed Central

    Miyahara, Yoichi; Aeschimann, Laure; Grütter, Peter

    2015-01-01

    Summary Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. PMID:26199849

  12. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    NASA Astrophysics Data System (ADS)

    Haemmerli, Alexandre J.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David; Pruitt, Beth L.

    2015-07-01

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz-10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  13. Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

    SciTech Connect

    Haemmerli, Alexandre J.; Pruitt, Beth L.; Harjee, Nahid; Koenig, Markus; Garcia, Andrei G. F.; Goldhaber-Gordon, David

    2015-07-21

    The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad potential profiles. Shielded probes could offer higher resolution and easier data interpretation in the study of nanostructures. Electrical scanning probe techniques require a method of locating structures of interest, often by mapping surface topography. As the samples studied with these techniques are often photosensitive, the typical laser measurement of cantilever deflection can excite the sample, causing undesirable changes electrical properties. In this work, we present the design, fabrication, and characterization of probes that integrate coaxial tips for spatially sharp potential profiles with piezoresistors for self-contained, electrical displacement sensing. With the apex 100 nm above the sample surface, the electrostatic potential profile produced by our coaxial tips is more than 2 times narrower than that of unshielded tips with no long tails. In a scan bandwidth of 1 Hz–10 kHz, our probes have a displacement resolution of 2.9 Å at 293 K and 79 Å at 2 K, where the low-temperature performance is limited by amplifier noise. We show scanning gate microscopy images of a quantum point contact obtained with our probes, highlighting the improvement to lateral resolution resulting from the coaxial tip.

  14. Hydrodynamic effects of the tip movement on surface nanobubbles: a combined tapping mode, lift mode and force volume mode AFM study.

    PubMed

    Walczyk, Wiktoria; Hain, Nicole; Schönherr, Holger

    2014-08-28

    We report on an Atomic Force Microscopy (AFM) study of AFM tip-nanobubble interactions in experiments conducted on argon surface nanobubbles on HOPG (highly oriented pyrolytic graphite) in water in tapping mode, lift mode and Force Volume (FV) mode AFM. By subsequent data acquisition on the same nanobubbles in these three different AFM modes, we could directly compare the effect of different tip-sample interactions. The tip-bubble interaction strength was found to depend on the vertical and horizontal position of the tip on the bubble with respect to the bubble center. The interaction forces measured experimentally were in good agreement with the forces calculated using the dynamic interaction model. The strength of the hydrodynamic effect was also found to depend on the direction of the tip movement. It was more pronounced in the FV mode, in which the tip approaches the bubble from the top, than in the lift mode, in which the tip approaches the bubble from the side. This result suggests that the direction of tip movement influences the bubble deformation. The effect should be taken into account when nanobubbles are analysed by AFM in various scanning modes.

  15. In-situ piezoresponse force microscopy cantilever mode shape profiling

    SciTech Connect

    Proksch, R.

    2015-08-21

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  16. In-situ piezoresponse force microscopy cantilever mode shape profiling

    NASA Astrophysics Data System (ADS)

    Proksch, R.

    2015-08-01

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  17. Tip in-light on: Advantages, challenges, and applications of combining AFM and Raman microscopy on biological samples.

    PubMed

    Prats-Mateu, Batirtze; Gierlinger, Notburga

    2017-01-01

    Scanning probe microscopies and spectroscopies, especially AFM and Confocal Raman microscopy are powerful tools to characterize biological materials. They are both non-destructive methods and reveal mechanical and chemical properties on the micro and nano-scale. In the last years the interest for increasing the lateral resolution of optical and spectral images has driven the development of new technologies that overcome the diffraction limit of light. The combination of AFM and Raman reaches resolutions of about 50-150 nm in near-field Raman and 1.7-50 nm in tip enhanced Raman spectroscopy (TERS) and both give a molecular information of the sample and the topography of the scanned surface. In this review, the mentioned approaches are introduced, the main advantages and problems for application on biological samples discussed and some examples for successful experiments given. Finally the potential of colocated AFM and Raman measurements is shown on a case study of cellulose-lignin films: the topography structures revealed by AFM can be related to a certain chemistry by the colocated Raman scan and additionally the mechanical properties be revealed by using the digital pulsed force mode. Microsc. Res. Tech. 80:30-40, 2017. © 2016 Wiley Periodicals, Inc.

  18. Tip in–light on: Advantages, challenges, and applications of combining AFM and Raman microscopy on biological samples

    PubMed Central

    Gierlinger, Notburga

    2016-01-01

    Abstract Scanning probe microscopies and spectroscopies, especially AFM and Confocal Raman microscopy are powerful tools to characterize biological materials. They are both non‐destructive methods and reveal mechanical and chemical properties on the micro and nano‐scale. In the last years the interest for increasing the lateral resolution of optical and spectral images has driven the development of new technologies that overcome the diffraction limit of light. The combination of AFM and Raman reaches resolutions of about 50–150 nm in near‐field Raman and 1.7–50 nm in tip enhanced Raman spectroscopy (TERS) and both give a molecular information of the sample and the topography of the scanned surface. In this review, the mentioned approaches are introduced, the main advantages and problems for application on biological samples discussed and some examples for successful experiments given. Finally the potential of colocated AFM and Raman measurements is shown on a case study of cellulose‐lignin films: the topography structures revealed by AFM can be related to a certain chemistry by the colocated Raman scan and additionally the mechanical properties be revealed by using the digital pulsed force mode. Microsc. Res. Tech. 80:30–40, 2017. © 2016 Wiley Periodicals, Inc. PMID:27514318

  19. Integrin-Specific Mechanoresponses to Compression and Extension Probed by Cylindrical Flat-Ended AFM Tips in Lung Cells

    PubMed Central

    Acerbi, Irene; Luque, Tomás; Giménez, Alícia; Puig, Marta; Reguart, Noemi; Farré, Ramon; Navajas, Daniel; Alcaraz, Jordi

    2012-01-01

    Cells from lung and other tissues are subjected to forces of opposing directions that are largely transmitted through integrin-mediated adhesions. How cells respond to force bidirectionality remains ill defined. To address this question, we nanofabricated flat-ended cylindrical Atomic Force Microscopy (AFM) tips with ∼1 µm2 cross-section area. Tips were uncoated or coated with either integrin-specific (RGD) or non-specific (RGE/BSA) molecules, brought into contact with lung epithelial cells or fibroblasts for 30 s to form focal adhesion precursors, and used to probe cell resistance to deformation in compression and extension. We found that cell resistance to compression was globally higher than to extension regardless of the tip coating. In contrast, both tip-cell adhesion strength and resistance to compression and extension were the highest when probed at integrin-specific adhesions. These integrin-specific mechanoresponses required an intact actin cytoskeleton, and were dependent on tyrosine phosphatases and Ca2+ signaling. Cell asymmetric mechanoresponse to compression and extension remained after 5 minutes of tip-cell adhesion, revealing that asymmetric resistance to force directionality is an intrinsic property of lung cells, as in most soft tissues. Our findings provide new insights on how lung cells probe the mechanochemical properties of the microenvironment, an important process for migration, repair and tissue homeostasis. PMID:22384196

  20. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect

    Balantekin, M.; Satır, S.; Torello, D.; Değertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  1. Atomic force microscope cantilever calibration using a focused ion beam.

    PubMed

    Slattery, Ashley D; Quinton, Jamie S; Gibson, Christopher T

    2012-07-20

    A calibration method is presented for determining the spring constant of atomic force microscope (AFM) cantilevers, which is a modification of the established Cleveland added mass technique. A focused ion beam (FIB) is used to remove a well-defined volume from a cantilever with known density, substantially reducing the uncertainty usually present in the added mass method. The technique can be applied to any type of AFM cantilever; but for the lowest uncertainty it is best applied to silicon cantilevers with spring constants above 0.7 N m(-1), where uncertainty is demonstrated to be typically between 7 and 10%. Despite the removal of mass from the cantilever, the calibration method presented does not impair the probes' ability to acquire data. The technique has been extensively tested in order to verify the underlying assumptions in the method. This method was compared to a number of other calibration methods and practical improvements to some of these techniques were developed, as well as important insights into the behavior of FIB modified cantilevers. These results will prove useful to research groups concerned with the application of microcantilevers to nanoscience, in particular for cases where maintaining pristine AFM tip condition is critical.

  2. Piezoelectric cantilever sensors

    NASA Technical Reports Server (NTRS)

    Shih, Wan Y. (Inventor); Shih, Wei-Heng (Inventor); Shen, Zuyan (Inventor)

    2008-01-01

    A piezoelectric cantilever with a non-piezoelectric, or piezoelectric tip useful as mass and viscosity sensors. The change in the cantilever mass can be accurately quantified by monitoring a resonance frequency shift of the cantilever. For bio-detection, antibodies or other specific receptors of target antigens may be immobilized on the cantilever surface, preferably on the non-piezoelectric tip. For chemical detection, high surface-area selective absorbent materials are coated on the cantilever tip. Binding of the target antigens or analytes to the cantilever surface increases the cantilever mass. Detection of target antigens or analytes is achieved by monitoring the cantilever's resonance frequency and determining the resonance frequency shift that is due to the mass of the adsorbed target antigens on the cantilever surface. The use of a piezoelectric unimorph cantilever allows both electrical actuation and electrical sensing. Incorporating a non-piezoelectric tip (14) enhances the sensitivity of the sensor. In addition, the piezoelectric cantilever can withstand damping in highly viscous liquids and can be used as a viscosity sensor in wide viscosity range.

  3. Large-Scale Fabrication of Carbon Nanotube Probe Tips For Atomic Force Microscopy Critical Dimension Imaging Applications

    NASA Technical Reports Server (NTRS)

    Ye, Qi Laura; Cassell, Alan M.; Stevens, Ramsey M.; Meyyappan, Meyya; Li, Jun; Han, Jie; Liu, Hongbing; Chao, Gordon

    2004-01-01

    Carbon nanotube (CNT) probe tips for atomic force microscopy (AFM) offer several advantages over Si/Si3N4 probe tips, including improved resolution, shape, and mechanical properties. This viewgraph presentation discusses these advantages, and the drawbacks of existing methods for fabricating CNT probe tips for AFM. The presentation introduces a bottom up wafer scale fabrication method for CNT probe tips which integrates catalyst nanopatterning and nanomaterials synthesis with traditional silicon cantilever microfabrication technology. This method makes mass production of CNT AFM probe tips feasible, and can be applied to the fabrication of other nanodevices with CNT elements.

  4. Current-dependent growth of silicon nitride lines using a conducting tip AFM

    NASA Astrophysics Data System (ADS)

    Workman, R. K.; Peterson, C. A.; Sarid, D.

    1999-03-01

    The measurement of a picoamp current accompanying silicon nitride line growth in an ammonia atmosphere, using a conducting tip atomic force microscope, is reported for the first time. The observed total charge per nanolithographed volume is found to be consistent with a process where the reduction of H + ions belonging to the ammonia gives rise to the nitridation of the silicon substrate.

  5. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid.

    PubMed

    Miyazawa, K; Izumi, H; Watanabe-Nakayama, T; Asakawa, H; Fukuma, T

    2015-03-13

    Recently, possibilities of improving operation speed and force sensitivity in atomic-scale atomic force microscopy (AFM) in liquid using a small cantilever with an electron beam deposited (EBD) tip have been intensively explored. However, the structure and properties of an EBD tip suitable for such an application have not been well-understood and hence its fabrication process has not been established. In this study, we perform atomic-scale AFM measurements with a small cantilever and clarify two major problems: contaminations from a cantilever and tip surface, and insufficient mechanical strength of an EBD tip having a high aspect ratio. To solve these problems, here we propose a fabrication process of an EBD tip, where we attach a 2 μm silica bead at the cantilever end and fabricate a 500-700 nm EBD tip on the bead. The bead height ensures sufficient cantilever-sample distance and enables to suppress long-range interaction between them even with a short EBD tip having high mechanical strength. After the tip fabrication, we coat the whole cantilever and tip surface with Si (30 nm) to prevent the generation of contamination. We perform atomic-scale AFM imaging and hydration force measurements at a mica-water interface using the fabricated tip and demonstrate its applicability to such an atomic-scale application. With a repeated use of the proposed process, we can reuse a small cantilever for atomic-scale measurements for several times. Therefore, the proposed method solves the two major problems and enables the practical use of a small cantilever in atomic-scale studies on various solid-liquid interfacial phenomena.

  6. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid

    NASA Astrophysics Data System (ADS)

    Miyazawa, K.; Izumi, H.; Watanabe-Nakayama, T.; Asakawa, H.; Fukuma, T.

    2015-03-01

    Recently, possibilities of improving operation speed and force sensitivity in atomic-scale atomic force microscopy (AFM) in liquid using a small cantilever with an electron beam deposited (EBD) tip have been intensively explored. However, the structure and properties of an EBD tip suitable for such an application have not been well-understood and hence its fabrication process has not been established. In this study, we perform atomic-scale AFM measurements with a small cantilever and clarify two major problems: contaminations from a cantilever and tip surface, and insufficient mechanical strength of an EBD tip having a high aspect ratio. To solve these problems, here we propose a fabrication process of an EBD tip, where we attach a 2 μm silica bead at the cantilever end and fabricate a 500-700 nm EBD tip on the bead. The bead height ensures sufficient cantilever-sample distance and enables to suppress long-range interaction between them even with a short EBD tip having high mechanical strength. After the tip fabrication, we coat the whole cantilever and tip surface with Si (30 nm) to prevent the generation of contamination. We perform atomic-scale AFM imaging and hydration force measurements at a mica-water interface using the fabricated tip and demonstrate its applicability to such an atomic-scale application. With a repeated use of the proposed process, we can reuse a small cantilever for atomic-scale measurements for several times. Therefore, the proposed method solves the two major problems and enables the practical use of a small cantilever in atomic-scale studies on various solid-liquid interfacial phenomena.

  7. AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects.

    PubMed

    Fresco, Zachary M; Suez, Itai; Backer, Scott A; Fréchet, Jean M J

    2004-07-14

    An alpha,alpha-dimethyl-3,5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios.

  8. Solid-state SiO₂ nano-gears AFM tip manipulation on HOPG.

    PubMed

    Yang, Jianshu; Deng, Jie; Troadec, Cedic; Ondarçuhu, Thierry; Joachim, Christian

    2014-11-21

    On a native graphite surface, 15 nm-thick solid-state nanogears are nanofabricated with a 30 nm outer diameter and six teeth. The nanogears are manipulated one at a time by the tip of an atomic force microscope using the sample stage displacements for the manipulation and recording of the corresponding manipulation signals. For step heights below 3.0 nm, nanogears are manipulated up and down native graphite surface step edges. In the absence of a central shaft per nanogear, gearing between nanogears is limited to a few 1/12 turns for six teeth. When the graphite step is higher than 3 nm, a rack-and-pinion mechanism was constructed along the edge with a 90 nm nanogear pinion.

  9. Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

    PubMed Central

    2013-01-01

    Abstract A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS 07.79.Lh, 81.16.-c, 84.37. + q PMID:24314111

  10. Control of tip-to-sample distance in atomic force microscopy: A dual-actuator tip-motion control scheme

    NASA Astrophysics Data System (ADS)

    Jeong, Younkoo; Jayanth, G. R.; Menq, Chia-Hsiang

    2007-09-01

    The control of tip-to-sample distance in atomic force microscopy (AFM) is achieved through controlling the vertical tip position of the AFM cantilever. In the vertical tip-position control, the required z motion is commanded by laser reading of the vertical tip position in real time and might contain high frequency components depending on the lateral scanning rate and topographical variations of the sample. This paper presents a dual-actuator tip-motion control scheme that enables the AFM tip to track abrupt topographical variations. In the dual-actuator scheme, an additional magnetic mode actuator is employed to achieve high bandwidth tip-motion control while the regular z scanner provides the necessary motion range. This added actuator serves to make the entire cantilever bandwidth available for tip positioning, and thus controls the tip-to-sample distance. A fast programmable electronics board was employed to realize the proposed dual-actuator control scheme, in which model cancellation algorithms were implemented to enlarge the bandwidth of the magnetic actuation and to compensate the lightly damped dynamics of the cantilever. Experiments were conducted to illustrate the capabilities of the proposed dual-actuator tip-motion control in terms of response speed and travel range. It was shown that while the bandwidth of the regular z scanner was merely a small fraction of the cantilever's bandwidth, the dual-actuator control scheme led to a tip-motion control system, the bandwidth of which was comparable to that of the cantilever, where the dynamics overdamped, and the motion range comparable to that of the z scanner.

  11. A direct micropipette-based calibration method for atomic force microscope cantilevers

    PubMed Central

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes. PMID:19566228

  12. Mechanical response of adherent giant liposomes to indentation with a conical AFM-tip.

    PubMed

    Schäfer, Edith; Vache, Marian; Kliesch, Torben-Tobias; Janshoff, Andreas

    2015-06-14

    Indentation of giant liposomes with a conical indenter is described by means of a tension-based membrane model. We found that nonlinear membrane theory neglecting the impact of bending sufficiently describes the mechanical response of liposomes to indentation as measured by atomic force microscopy. Giant vesicles are gently adsorbed on glassy surfaces via avidin-biotin linkages and indented centrally using an atomic force microscope equipped with conventional sharp tips mounted on top of an inverted microscope. Force indentation curves display a nonlinear response that allows to extract pre-stress of the bilayer T0 and the area compressibility modulus KA by computing the contour of the vesicle at a given force. The values for KA of fluid membranes correspond well to what is known from micropipet suction experiments and inferred from membrane undulation monitoring. Assembly of actin shells inside the liposome considerably stiffens the vesicles resulting in significantly larger area compressibility modules. The analysis can be easily extended to different indenter geometries with rotational symmetry.

  13. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.

    PubMed

    Gates, Richard S; Reitsma, Mark G

    2007-08-01

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  14. AFM nanoscale indentation in air of polymeric and hybrid materials with highly different stiffness

    NASA Astrophysics Data System (ADS)

    Suriano, Raffaella; Credi, Caterina; Levi, Marinella; Turri, Stefano

    2014-08-01

    In this study, nanomechanical properties of a variety of polymeric materials was investigated by means of AFM. In particular, selecting different AFM probes, poly(methyl methacrylate) (PMMA), polydimethylsiloxane (PDMS) bulk samples, sol-gel hybrid thin films and hydrated hyaluronic acid hydrogels were indented in air to determine the elastic modulus. The force-distance curves and the indentation data were found to be greatly affected by the cantilever stiffness and by tip geometry. AFM indentation tests show that the choice of the cantilever spring constant and of tip shape is crucially influenced by elastic properties of samples. When adhesion-dominated interactions occur between the tip and the surface of samples, force-displacement curves reveal that a suitable functionalization of AFM probes allows the control of such interactions and the extraction of Young' modulus from AFM curves that would be otherwise unfeasible. By applying different mathematical models depending on AFM probes and materials under investigation, the values of Young's modulus were obtained and compared to those measured by rheological and dynamic mechanical analysis or to literature data. Our results show that a wide range of elastic moduli (10 kPa-10 GPa) can be determined by AFM in good agreement with those measured by conventional macroscopic measurements.

  15. Determining surface properties with bimodal and multimodal AFM.

    PubMed

    Forchheimer, D; Borysov, Stanislav S; Platz, D; Haviland, David B

    2014-12-05

    Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two or more resonance frequencies. Such excitation schemes result in one additional amplitude and phase images for each driven resonance, and potentially convey more information about the surface under investigation. Here we present a theoretical basis for using this information to approximate the parameters of a tip-surface interaction model. The theory is verified by simulations with added noise corresponding to room-temperature measurements.

  16. Tuning the instability in static mode atomic force spectroscopy as obtained in an AFM by applying an electric field between the tip and the substrate.

    PubMed

    Biswas, Soma; Raychaudhuri, A K; Sreeram, P A; Dietzel, Dirk

    2012-11-01

    We have investigated experimentally the role of cantilever instabilities in determination of the static mode force-distance curves in presence of a dc electric field. The electric field has been applied between the tip and the sample in an atomic force microscope working in ultra-high vacuum. We have shown how an electric field modifies the observed force (or cantilever deflection)-vs-distance curves, commonly referred to as the static mode force spectroscopy curves, taken using an atomic force microscope. The electric field induced instabilities shift the jump-into-contact and jump-off-contact points and also the deflection at these instability points. We explained the experimental results using a model of the tip-sample interaction and quantitatively established a relation between the observed static mode force spectroscopy curves and the applied electric field which modifies the effective tip-sample interaction in a controlled manner. The investigation establishes a way to quantitatively evaluate the electrostatic force in an atomic force microscope using the static mode force spectroscopy curves.

  17. Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi

    2016-08-01

    In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. Both optical and mechanical detection techniques were adopted in SNOM to detect scattered light induced by the interaction of the PZT cantilever tip apex and evanescent light, and SNOM images were obtained for each detection scheme. The mechanical detection technique did allow for a clear observation of the light scattered from the PZT cantilever without the interference observed by the optical detection technique, which used an objective lens, a pinhole, and a photomultiplier tube.

  18. Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process

    NASA Astrophysics Data System (ADS)

    Villeneuve-Faure, C.; Makasheva, K.; Boudou, L.; Teyssedre, G.

    2016-06-01

    Charge injection and retention in thin dielectric layers remain critical issues for the reliability of many electronic devices because of their association with a large number of failure mechanisms. To overcome this drawback, a deep understanding of the mechanisms leading to charge injection close to the injection area is needed. Even though the charge injection is extensively studied and reported in the literature to characterize the charge storage capability of dielectric materials, questions about charge injection mechanisms when using atomic force microscopy (AFM) remain open. In this paper, a thorough study of charge injection by using AFM in thin plasma-processed amorphous silicon oxynitride layers with properties close to that of thermal silica layers is presented. The study considers the impact of applied voltage polarity, work function of the AFM tip coating and tip curvature radius. A simple theoretical model was developed and used to analyze the obtained experimental results. The electric field distribution is computed as a function of tip geometry. The obtained experimental results highlight that after injection in the dielectric layer the charge lateral spreading is mainly controlled by the radial electric field component independently of the carrier polarity. The injected charge density is influenced by the nature of electrode metal coating (work function) and its geometry (tip curvature radius). The electron injection is mainly ruled by the Schottky injection barrier through the field electron emission mechanism enhanced by thermionic electron emission. The hole injection mechanism seems to differ from the electron one depending on the work function of the metal coating. Based on the performed analysis, it is suggested that for hole injection by AFM, pinning of the metal Fermi level with the metal-induced gap states in the studied silicon oxynitride layers starts playing a role in the injection mechanisms.

  19. Contrast mechanisms on nanoscale subsurface imaging in ultrasonic AFM: scattering of ultrasonic waves and contact stiffness of the tip-sample.

    PubMed

    Sharahi, Hossein Jiryaei; Shekhawat, Gajendra; Dravid, Vinayak; Park, Simon; Egberts, Philip; Kim, Seonghwan

    2017-02-09

    Ultrasonic atomic force microscopy (AFM) and its associated derivatives are nondestructive techniques that can elucidate subsurface nanoscale structures and properties. Despite the usefulness of these techniques, the physical contrast mechanisms responsible for the reported subsurface features observed in ultrasonic AFM are not well defined. In this study, we present a comprehensive model combining ultrasonic wave scattering and tip-sample contact stiffness to better reproduce the experimentally measured phase variations over subsurface features in two model systems. These model systems represent the two extreme sample types typically imaged by ultrasonic AFM, one being a hard material and the other a soft polymeric material. The theoretical analysis presented and associated comparisons with experimental results suggest that the image contrast depends on the combination of two contrast mechanisms: the perturbation of the scattered ultrasonic waves and the local variation of the contact stiffness at the tip-sample contact. The results of this study open up a new door for the depth estimation of buried nanoscale features into hard (engineering structures) and soft (polymers and biological structures) materials, and eventually lead to non-invasive, high-resolution 3D nano-tomography by ultrasonic AFM.

  20. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  1. Analyzing the effect of the forces exerted on cantilever probe tip of atomic force microscope with tapering-shaped geometry and double piezoelectric extended layers in the air and liquid environments

    NASA Astrophysics Data System (ADS)

    Korayem, Moharam Habibnejad; Nahavandi, Amir

    2017-01-01

    The aim of the present study is to assess the force vibrational performance of tapering-shaped cantilevers, using Euler-Bernoulli theory. Tapering-shaped cantilevers have plan-view geometry consisting of a rectangular section at the clamped end and a triangular section at the tip. Hamilton's principle is utilized to obtain the partial differential equations governing the nonlinear vibration of the system as well as the corresponding boundary conditions. In this model, a micro cantilever, which is covered by two piezoelectric layers at the top and the bottom, is modeled at angle α. Both of these layers are subjected to similar AC and DC voltages. This paper attempts to determine the effect of the capillary force exerted on the cantilever probe tip of an atomic force microscope. The capillary force emerges due to the contact between thin water films with a thickness of hc which have accumulated on the sample and the probe. In addition, an attempt is made to develop the capillary force between the tip and the sample surface with respect to the geometry obtained. The smoothness or the roughness of the surfaces as well as the geometry of the cantilever tip have significant effects on the modeling of forces applied to the probe tip. In this article, the Van der Waals and the repulsive forces are considered to be the same in all of the simulations, and only is the capillary force altered in order to evaluate the role of this force in the atomic force microscope based modeling. We also indicate that the tip shape and the radial distance of the meniscus greatly influence the capillary force. The other objective of our study is to draw a comparison between tapering-and rectangular-shaped cantilevers. Furthermore, the equation for converting the tip of a tapering-shaped cantilever into a rectangular cantilever is provided. Moreover, the modal analysis method is employed to solve the motion equation. The mode shape function for the two tapering-shaped sections of the first

  2. New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy

    NASA Astrophysics Data System (ADS)

    Dai, G.; Hässler-Grohne, W.; Hüser, D.; Wolff, H.; Fluegge, J.; Bosse, H.

    2011-06-01

    A new 3D-AFM for true 3D measurements of nano structures has been developed at Physikalisch Technische-Bundesanstalt, the national metrology institute of Germany. In its configuration, two piezo actuators are applied to drive the AFM cantilever near its vertical and torsional resonant frequencies. In such a way, the AFM tip can probe the surface with a vertical and/or a lateral oscillation, offering high 3D probing sensitivity. For enhancing measurement flexibility as well as reducing tip wear, a so called "vector approach probing" (VAP) method has been applied. The sample is measured point by point using this method. At each probing point, the tip is approached towards the surface in its normal direction until the desired tip-sample interaction is detected and then immediately withdrawn from the surface. Preliminary experimental results show promising performance of the developed system. The measurement of a line structure of 800 nm height employing a super sharp AFM tip is performed, showing a repeatability of its 3D profiles of better than 1 nm (p-v). A single crystal critical dimension reference material (SCCDRM) having features with almost vertical sidewall is measured using a flared AFM tip. Results show that the feature has averaged left and right sidewall angles of 88.64° and 88.67deg;, respectively. However, the feature width non-uniformity may reach 10 nm within the measurement range of 1 μm. The standard deviation of the averaged middle CD values of 7 repeated measurements reaches 0.35 nm. In addition, an investigation of long term measurement stability is performed on a PTB photomask. The results shows that the 3D-AFM has a drift rate of about 0.00033 nm per line, which confirms the high measurement stability and the very low tip wear.

  3. In-plane information from tapping mode AFM images

    NASA Astrophysics Data System (ADS)

    Marcus, Matthew

    2003-03-01

    Phase contrast in intermittent-contact atomic force microscopy is shown to reveal in-plane structural and mechanical properties of poly(diacetylene) monolayer films. This is surprising because measurements of in-plane properties typically require a contact mode of microscopy. Such measurements are possible because the tilt in the oscillating cantilever provides components of motion not just perpendicular to the surface, but also parallel to the sample surface. Lateral tip displacement is virtually universal in AFM, implying that any oscillating tip-AFM technique is sensitive to in-plane material properties. Although the tilt in the cantilever is small ( 10^o) it produces a component of motion that is 20% of the total tip displacement, and this motion accounts for 5-10% of dissipated energy through the tip-sample interaction[1]. The data is used in conjunction with a numerical model to extract in-plane material parameters. The effect of the cantilever tilt on phase measurements is directly verified through measurements on silicon samples tilted at a variety of angles with respect to the cantilever. The lateral tip displacement we make use of allows measurements of in-plane properties of soft samples such as polymer and biological samples. This work was done in collaboration with M. D'Amato, R.W. Carpick, and M.A. Eriksson, and was supported by the NSF CAREER and MRSEC programs and the Research Corporation. 1. M.S. Marcus, R.W. Carpick, D.Y. Sasaki, M.A. Eriksson, Phys. Rev. Lett. 88, 226103 (2002)

  4. Compact metal probes: a solution for atomic force microscopy based tip-enhanced Raman spectroscopy.

    PubMed

    Rodriguez, R D; Sheremet, E; Müller, S; Gordan, O D; Villabona, A; Schulze, S; Hietschold, M; Zahn, D R T

    2012-12-01

    There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

  5. In vivo characterization of protein uptake by yeast cell envelope: single cell AFM imaging and μ-tip-enhanced Raman scattering study.

    PubMed

    Naumenko, Denys; Snitka, Valentinas; Serviene, Elena; Bruzaite, Ingrida; Snopok, Boris

    2013-09-21

    Direct detection of biological transformations of single living cells in vivo has been performed by the advanced combination of local topographic imaging by Atomic Force Microscopy (AFM) and label-free sub-surface chemical characterization using new μ-Tip-Enhanced Raman Spectroscopy (μ-TERS). The enhancing mechanism for μ-TERS tips with micrometre range radius differs significantly to that of the conventional tapered structures terminated by a sharp apex and conditioned by the effects of propagating instead of localizing surface plasmon resonance phenomena. Sub-wavelength light confinement in the form of a nonradiative evanescent wave near the tip surface with penetration depth in the sub-micrometre range opens the way for monitoring of subsurface processes near or within the cell wall, inaccessible by other methods. The efficiency of the approach has been demonstrated by the analysis of the cell envelope of genetically modified (by glucose dehydrogenase (GDH) gene bearing Kluyveromyces lactis toxin signal sequence) yeast cells enriched by GDH protein. The presence of trans-membrane fragments in GDH together with the tendency to form active dimers and tetramers causes the accumulation of the proteins within the periplasmic space. These results demonstrate that the advanced combination of AFM imaging and subsurface chemical characterization by the novel μ-TERS technique provides a new analytical tool for the investigation of single living cells in vivo.

  6. Measurement of deep groove structures using a self-fabricated long tip in a large range metrological atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wang, S. H.; Tan, S. L.; Xu, G.; Koyama, K.

    2011-09-01

    Metrological atomic force microscopes are widely used in national metrology institutes for measuring step height, lateral pitch and surface roughness. However, the maximum measurable depth or height variation is limited by both the vertical scanning range of the AFM and the tip height and sharpness of the tip at the end of the cantilever. A normal commercial AFM typically has a vertical scanning range less than 10 µm and a tip height of the cantilever only up to 15 µm so that it can be used to detect only relatively smooth surfaces or shallow structures up to several micrometres. To overcome these limitations, we have successfully integrated a long diamond tip of up to 120 µm developed at Namiki Precision Jewel Co., Ltd of Japan onto our large range metrological atomic force microprobe (LRM-AFM) for deep groove structure measurement. The LRM-AFM is based on a nano-measuring machine with a large scanning range of 25 mm in the X and Y axes and 5 mm in the Z axis. This paper describes the long diamond tip fabrication process and especially its application in the LRM-AFM for measuring deep groove structures of a step height of up to 100 µm. In addition, the mechanical quality factor (Q) of the diamond tip micro-cantilever was detected in the system. The results demonstrate that the system is capable of calibrating and measuring the surface structure with deep groove in tens of micrometres.

  7. Development of a 3D-AFM for true 3D measurements of nanostructures

    NASA Astrophysics Data System (ADS)

    Dai, Gaoliang; Häßler-Grohne, Wolfgang; Hüser, Dorothee; Wolff, Helmut; Danzebrink, Hans-Ulrich; Koenders, Ludger; Bosse, Harald

    2011-09-01

    The development of advanced lithography requires highly accurate 3D metrology methods for small line structures of both wafers and photomasks. Development of a new 3D atomic force microscopy (3D-AFM) with vertical and torsional oscillation modes is introduced in this paper. In its configuration, the AFM probe is oscillated using two piezo actuators driven at vertical and torsional resonance frequencies of the cantilever. In such a way, the AFM tip can probe the surface with a vertical and a lateral oscillation, offering high 3D probing sensitivity. In addition, a so-called vector approach probing (VAP) method has been applied. The sample is measured point-by-point using this method. At each probing point, the tip is approached towards the surface until the desired tip-sample interaction is detected and then immediately withdrawn from the surface. Compared to conventional AFMs, where the tip is kept continuously in interaction with the surface, the tip-sample interaction time using the VAP method is greatly reduced and consequently the tip wear is reduced. Preliminary experimental results show promising performance of the developed system. A measurement of a line structure of 800 nm height employing a super sharp AFM tip could be performed with a repeatability of its 3D profiles of better than 1 nm (p-v). A line structure of a Physikalisch-Technische Bundesanstalt photomask with a nominal width of 300 nm has been measured using a flared tip AFM probe. The repeatability of the middle CD values reaches 0.28 nm (1σ). A long-term stability investigation shows that the 3D-AFM has a high stability of better than 1 nm within 197 measurements taken over 30 h, which also confirms the very low tip wear.

  8. Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy

    SciTech Connect

    Liu Yu; Guo Qiuquan; Nie Hengyong; Lau, W. M.; Yang Jun

    2009-12-15

    The mechanism of dynamic force modes has been successfully applied to many atomic force microscopy (AFM) applications, such as tapping mode and phase imaging. The high-order flexural vibration modes are recent advancement of AFM dynamic force modes. AFM optical lever detection sensitivity plays a major role in dynamic force modes because it determines the accuracy in mapping surface morphology, distinguishing various tip-surface interactions, and measuring the strength of the tip-surface interactions. In this work, we have analyzed optimization and calibration of the optical lever detection sensitivity for an AFM cantilever-tip ensemble vibrating in high-order flexural modes and simultaneously experiencing a wide range and variety of tip-sample interactions. It is found that the optimal detection sensitivity depends on the vibration mode, the ratio of the force constant of tip-sample interactions to the cantilever stiffness, as well as the incident laser spot size and its location on the cantilever. It is also found that the optimal detection sensitivity is less dependent on the strength of tip-sample interactions for high-order flexural modes relative to the fundamental mode, i.e., tapping mode. When the force constant of tip-sample interactions significantly exceeds the cantilever stiffness, the optimal detection sensitivity occurs only when the laser spot locates at a certain distance from the cantilever-tip end. Thus, in addition to the 'globally optimized detection sensitivity', the 'tip optimized detection sensitivity' is also determined. Finally, we have proposed a calibration method to determine the actual AFM detection sensitivity in high-order flexural vibration modes against the static end-load sensitivity that is obtained traditionally by measuring a force-distance curve on a hard substrate in the contact mode.

  9. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    PubMed

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-29

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  10. Constant tip-surface distance with atomic force microscopy via quality factor feedback

    NASA Astrophysics Data System (ADS)

    Fan, Lin; Potter, Daniel; Sulchek, Todd

    2012-02-01

    The atomic force microscope (AFM) is a powerful and widely used instrument to image topography and measure forces at the micrometer and nanometer length scale. Because of the high degree of operating accuracy required of the instrument, small thermal and mechanical drifts of the cantilever and piezoactuator systems hamper measurements as the AFM tip drifts spatially relative to the sample surface. To compensate for the drift, we control the tip-surface distance by monitoring the cantilever quality factor (Q) in a closed loop. Brownian thermal fluctuations provide sufficient actuation to accurately determine cantilever Q by fitting the thermal noise spectrum to a Lorentzian function. We show that the cantilever damping is sufficiently affected by the tip-surface distance so that the tip position of soft cantilevers can be maintained within 40 nm of a setpoint in air and within 3 nm in water with 95% reliability. Utilizing this method to hover the tip above a sample surface, we have the capability to study sensitive interactions at the nanometer length scale over long periods of time.

  11. Selective nano-patterning of graphene using a heated atomic force microscope tip

    SciTech Connect

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-15

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

  12. Wear-resistant diamond nanoprobe tips with integrated silicon heater for tip-based nanomanufacturing.

    PubMed

    Fletcher, Patrick C; Felts, Jonathan R; Dai, Zhenting; Jacobs, Tevis D; Zeng, Hongjun; Lee, Woo; Sheehan, Paul E; Carlisle, John A; Carpick, Robert W; King, William P

    2010-06-22

    We report exceptional nanoscale wear and fouling resistance of ultrananocrystalline diamond (UNCD) tips integrated with doped silicon atomic force microscope (AFM) cantilevers. The resistively heated probe can reach temperatures above 600 degrees C. The batch fabrication process produces UNCD tips with radii as small as 15 nm, with average radius 50 nm across the entire wafer. Wear tests were performed on substrates of quartz, silicon carbide, silicon, or UNCD. Tips were scanned for more than 1 m at a scan speed of 25 mum s(-1) at temperatures ranging from 25 to 400 degrees C under loads up to 200 nN. Under these conditions, silicon tips are partially or completely destroyed, while the UNCD tips exhibit little or no wear, no signs of delamination, and exceptional fouling resistance. We demonstrate nanomanufacturing of more than 5000 polymer nanostructures with no deterioration in the tip.

  13. AFM-Based Mechanical Nanomanipulation

    NASA Astrophysics Data System (ADS)

    Landolsi, Fakhreddine

    2011-12-01

    Advances in several research areas increase the need for more sophisticated fabrication techniques and better performing materials. Tackling this problem from a bottom-up perspective is currently an active field of research. The bottom-up fabrication procedure offers sub-nanometer accurate manipulation. At this time, candidates to achieve nanomanipulation include chemical (self-assembly), biotechnology methods (DNA-based), or using controllable physical forces (e.g. electrokinetic forces, mechanical forces). In this thesis, new methods and techniques for mechanical nanomanipulation using probe force interaction are developed. The considered probes are commonly used in Atomic Force Microscopes (AFMs) for high resolution imaging. AFM-based mechanical nanomanipulation will enable arranging nanoscale entities such as nanotubes and molecules in a precise and controlled manner to assemble and produce novel devices and systems at the nanoscale. The novelty of this research stems from the development of new modeling of the physics and mechanics of the tip interaction with nanoscale entities, coupled with the development of new smart cantilevers with multiple degrees of freedom. The gained knowledge from the conducted simulations and analysis is expected to enable true precision and repeatability of nanomanipulation tasks which is not feasible with existing methods and technologies.

  14. GaN nanowire tips for nanoscale atomic force microscopy.

    PubMed

    Behzadirad, Mahmoud; Nami, Mohsen; Rishinaramagalam, Ashwin; Feezell, Daniel; Busani, Tito

    2017-04-07

    Imaging of high-aspect-ratio nanostructures with sharp edges and straight walls in nanoscale metrology by Atomic Force Microscopy (AFM) has been challenging due to the mechanical properties and conical geometry of the majority of available commercial tips. Here we report on the fabrication of GaN probes for nanoscale metrology of high-aspect-ratio structures to enhance the resolution of AFM imaging and improve the durability of AFM tips. GaN nanowires (NWs) were fabricated using bottom-up and top-down techniques and bonded to Si cantilevers to scan vertical trenches on Si substrates. Over several scans, the GaN probes demonstrated excellent durability while scanning uneven structures and showed resolution enhancements in topography images, independent of scan direction, compared to commercial Si tips.

  15. Steering the Self-Assembly of Octadecylamine Monolayers on Mica by Controlled Mechanical Energy Transfer from the AFM Tip

    SciTech Connect

    Benitez, J.J.; Heredia-Guerrero, J.A.; Salmeron, M.

    2010-06-24

    We have studied the effect of mechanical energy transfer from the tip of an Atomic Force Microscope on the dynamics of self-assembly of monolayer films of octadecylamine on mica. The formation of the self-assembled film proceeds in two successive stages, the first being a fast adsorption from solution that follows a Langmuir isotherm. The second is a slower process of island growth by aggregation of the molecules dispersed on the surface. We found that the dynamics of aggregation can be altered substantially by the addition of mechanical energy into the system through controlled tip-surface interactions. This leads to either the creation of pinholes in existing islands as a consequence of vacancy concentration, and to the assembly of residual molecules into more compact islands.

  16. Prototype cantilevers for quantitative lateral force microscopy

    SciTech Connect

    Reitsma, Mark G.; Gates, Richard S.; Friedman, Lawrence H.; Cook, Robert F.

    2011-09-15

    Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

  17. Characterization of piesoelectric ZnO thin films and the fabrication of piezoelectric micro-cantilevers

    SciTech Connect

    Johnson, Raegan Lynn

    2005-01-01

    In Atomic Force Microscopy (AFM), a microcantilever is raster scanned across the surface of a sample in order to obtain a topographical image of the sample's surface. In a traditional, optical AFM, the sample rests on a bulk piezoelectric tube and a control loop is used to control the tip-sample separation by actuating the piezo-tube. This method has several disadvantages--the most noticeable one being that response time of the piezo-tube is rather long which leads to slow imaging speeds. One possible solution aimed at improving the speed of imaging is to incorporate a thin piezoelectric film on top of the cantilever beam. This design not only improves the speed of imaging because the piezoelectric film replaces the piezo-tube as an actuator, but the film can also act as a sensor. In addition, the piezoelectric film can excite the cantilever beam near its resonance frequency. This project aims to fabricate piezoelectric microcantilevers for use in the AFM. Prior to fabricating the cantilevers and also part of this project, a systematic study was performed to examine the effects of deposition conditions on the quality of piezoelectric ZnO thin films deposited by RF sputtering. These results will be presented. The deposition parameters that produced the highest quality ZnO film were used in the fabrication of the piezoelectric cantilevers. Unfortunately, the fabricated cantilevers warped due to the intrinsic stress of the ZnO film and were therefore not usable in the AFM. The complete fabrication process will be detailed, the results will be discussed and reasons for the warping will be examined.

  18. Nanomechanical assessment of human and murine collagen fibrils via atomic force microscopy cantilever-based nanoindentation.

    PubMed

    Andriotis, Orestis G; Manuyakorn, Wiparat; Zekonyte, Jurgita; Katsamenis, Orestis L; Fabri, Sebastien; Howarth, Peter H; Davies, Donna E; Thurner, Philipp J

    2014-11-01

    The nanomechanical assessment of collagen fibrils via atomic force microscopy (AFM) is of increasing interest within the biomedical research community. In contrast to conventional nanoindentation there exists no common standard for conducting experiments and analysis of data. Currently used analysis approaches vary between studies and validation of quantitative results is usually not performed, which makes comparison of data from different studies difficult. Also there are no recommendations with regards to the maximum indentation depth that should not be exceeded to avoid substrate effects. Here we present a methodology and analysis approach for AFM cantilever-based nanoindentation experiments that allows efficient use of captured data and relying on a reference sample for determination of tip shape. Further we show experimental evidence that maximum indentation depth on collagen fibrils should be lower than 10-15% of the height of the fibril to avoid substrate effects and we show comparisons between our and other approaches used in previous works. While our analysis approach yields similar values for indentation modulus compared to the Oliver-Pharr method we found that Hertzian analysis yielded significantly lower values. Applying our approach we successfully and efficiently indented collagen fibrils from human bronchi, which were about 30 nm in size, considerably smaller compared to collagen fibrils obtained from murine tail-tendon. In addition, derived mechanical parameters of collagen fibrils are in agreement with data previously published. To establish a quantitative validation we compared indentation results from conventional and AFM cantilever-based nanoindentation on polymeric samples with known mechanical properties. Importantly we can show that our approach yields similar results when compared to conventional nanoindentation on polymer samples. Introducing an approach that is reliable, efficient and taking into account the AFM tip shape, we anticipate

  19. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    SciTech Connect

    Wang, Andrew; Butte, Manish J.

    2014-08-04

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  20. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    PubMed Central

    Wang, Andrew; Butte, Manish J.

    2014-01-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished. PMID:25161320

  1. Fiber-top and ferrule-top cantilevers for atomic force microscopy and scanning near field optical microscopy

    NASA Astrophysics Data System (ADS)

    Chavan, Dhwajal; Gruca, Grzegorz; van de Watering, Tomek; Heeck, Kier; Rector, Jan; Slaman, Martin; Andres, Dieter; Tiribilli, Bruno; Margheri, Giancarlo; Iannuzzi, Davide

    2012-04-01

    Fiber-top and ferrule-top cantilevers (FTC) are a new generation of all optical, monolithic, self-aligned microdevices. They are obtained by carving a cantilever on the cleaved end of an optical fiber (fiber-top) or on a ferrule terminated fiber (ferrule-top). FTCs rely on Fabry-Perot interferometry to measure the deflection of the cantilever with subnanometer deflection sensitivity. FTCs specially developed for scanning probe microscopy are equipped with a sharp tip that has the dual function of probing the topography and collecting/emitting light. We perform the scanning probe microscopy using these probes in air, liquid and at low temperature (12°K). The light emission/collection functionality of FTC probes also allows one to combine scanning near field optical microscopy (SNOM) and optical transmission microscopy with contact and non-contact mode atomic force microscopy (AFM). This makes FTCs ideal for AFM+SNOM on soft samples, polymers and biological specimen, where bent fiber probes and tuning fork based systems would not be recommended because of the high stiffness of those probes. We demonstrate here the capability of fiber-top cantilevers to measure deflection and collect near field optical signal, and also the capability of ferrule-top cantilevers for simultaneous optical transmission microscopy and topography of SNOM gratings. Thanks to their unique features, FTCs also open up possibilities for UV nanolithography and on-demand optical excitation at nanoscale.

  2. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

    PubMed Central

    Klocke, Michael

    2016-01-01

    Summary A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  3. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively.

  4. Cantilever biosensors.

    PubMed

    Fritz, Jürgen

    2008-07-01

    This review will provide a general introduction to the field of cantilever biosensors by discussing the basic principles and the basic technical background necessary to understand and evaluate this class of sensors. Microfabricated cantilever sensors respond to changes in their environment or changes on their surface with a mechanical bending in the order of nanometers which can easily be detected. They are able to detect pH and temperature changes, the formation of self-assembled monolayers, DNA hybridization, antibody-antigen interactions, or the adsorption of bacteria. The review will focus on the surface stress mode of microfabricated cantilever arrays and their application as biosensors in molecular life science. A general background on biosensors, an overview of the different modes of operation of cantilever sensors and some details on sensor functionalization will be given. Finally, key experiments and current theoretical efforts to describe the surface stress mode of cantilever sensors will be discussed.

  5. Nanoscale thermal AFM of polymers: transient heat flow effects.

    PubMed

    Duvigneau, Joost; Schönherr, Holger; Vancso, G Julius

    2010-11-23

    Thermal transport around the nanoscale contact area between the heated atomic force microscopy (AFM) probe tip and the specimen under investigation is a central issue in scanning thermal microscopy (SThM). Polarized light microscopy and AFM imaging of the temperature-induced crystallization of poly(ethylene terephthalate) (PET) films in the region near the tip were used in this study to unveil the lateral heat transport. The radius of the observed lateral surface isotherm at 133 °C ranged from 2.2 ± 0.5 to 18.7 ± 0.5 μm for tip-polymer interface temperatures between 200 and 300 °C with contact times varying from 20 to 120 s, respectively. In addition, the heat transport into polymer films was assessed by measurements of the thermal expansion of poly(dimethyl siloxane) (PDMS) films with variable thickness on silicon supports. Our data showed that heat transport in the specimen normal (z) direction occurred to depths exceeding 1000 μm using representative non-steady-state SThM conditions (i.e., heating from 40 to 180 °C at a rate of 10 °C s(-1)). On the basis of the experimental results, a 1D steady-state model for heat transport was developed, which shows the temperature profile close to the tip-polymer contact. The model also indicates that ≤1% of the total power generated in the heater area, which is embedded in the cantilever end, is transported into the polymer through the tip-polymer contact interface. Our results complement recent efforts in the evaluation and improvement of existing theoretical models for thermal AFM, as well as advance further developments of SThM for nanoscale thermal materials characterization and/or manipulation via scanning thermal lithography (SThL).

  6. Nanoscale rippling on polymer surfaces induced by AFM manipulation

    PubMed Central

    2015-01-01

    Summary Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored and studied. Due to the possibility of varying and controlling various parameters, this phenomenon has recently gained a great interest for some technological applications. The advent of AFM cantilevers with integrated heaters has promoted further advances in the field. An alternative method to heating up the tip is based on solvent-assisted viscoplastic deformations, where the ripples develop upon the application of a relatively low force to a solvent-rich film. An ensemble of AFM-based procedures can thus produce nanoripples on polymeric surfaces quickly, efficiently, and with an unprecedented order and control. However, even if nanorippling has been observed in various distinct modes and many theoretical models have been since proposed, a full understanding of this phenomenon is still far from being achieved. This review aims at summarizing the current state of the art in the perspective of achieving control over the rippling process on polymers at a nanoscale level. PMID:26733086

  7. Vertically aligned nanostructure scanning probe microscope tips

    DOEpatents

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  8. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  9. Reconstructing the distributed force on an atomic force microscope cantilever

    NASA Astrophysics Data System (ADS)

    Wagner, Ryan; Killgore, Jason

    2017-03-01

    A methodology is developed to reconstruct the force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting Bernoulli–Euler beam theory such that the force on the cantilever is approximated as a linear superposition of the theoretical cantilever eigenmodes. The weighting factors in this summation are calculated from the amplitude and phase measured along the length of the cantilever. The accuracy of the force reconstruction is shown to depend on the frequency at which the measurement is performed, the number of discrete points measured along the length of the cantilever, and the signal-to-noise ratio of the measured signal. In contrast to other AFM force reconstruction techniques, this method can reconstruct the distribution of force applied over the length of the AFM cantilever. However, this method performs poorly for localized forces applied to the cantilever, such as is typical of most tip–sample interaction forces. Proof of concept experiments are performed on an electrostatically excited cantilever and the expected force distribution is recovered. This force reconstruction technique offers previously unavailable insight into the distributed forces experienced by an AFM cantilever.

  10. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    PubMed

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

  11. Combination STM/AFM and AFM Images of Magnetic Domains

    NASA Astrophysics Data System (ADS)

    Yi, L.; Gallagher, M.; Howells, S.; Chen, T.; Sarid, D.

    1991-12-01

    By employing a cantilevered tip in a scanning tunneling microscope, one obtains images that show an enhancement of features associated with forces whose derivatives vary along the direction of scanning. The theory of this process is described together with experimental results showing magnetic domains on a gold coated floppy disk. Also shown are atomic force microscopy images of a ferrofluid-developed magnetic tape.

  12. Three-dimensional atomic force microscopy: interaction force vector by direct observation of tip trajectory.

    PubMed

    Sigdel, Krishna P; Grayer, Justin S; King, Gavin M

    2013-11-13

    The prospect of a robust three-dimensional atomic force microscope (AFM) holds significant promise in nanoscience. Yet, in conventional AFM, the tip-sample interaction force vector is not directly accessible. We scatter a focused laser directly off an AFM tip apex to rapidly and precisely measure the tapping tip trajectory in three-dimensional space. This data also yields three-dimensional cantilever spring constants, effective masses, and hence, the tip-sample interaction force components via Newton's second law. Significant lateral forces representing 49 and 13% of the normal force (Fz = 152 ± 17 pN) were observed in common tapping mode conditions as a silicon tip intermittently contacted a glass substrate in aqueous solution; as a consequence, the direction of the force vector tilted considerably more than expected. When addressing the surface of a lipid bilayer, the behavior of the force components differed significantly from that observed on glass. This is attributed to the lateral mobility of the lipid membrane coupled with its elastic properties. Direct access to interaction components Fx, Fy, and Fz provides a more complete view of tip dynamics that underlie force microscope operation and can form the foundation of a three-dimensional AFM in a plurality of conditions.

  13. Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

    PubMed Central

    Ruppert, Michael G; Yong, Yuen Kuan

    2017-01-01

    Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous characteristics compared to the optical beam deflection method. The possibility of down scaling, parallelization of cantilever arrays and the absence of optical interference associated imaging artifacts have led to an increased research interest in these methods. However, for multifrequency AFM, the optimization of the transducer layout on the cantilever for higher order modes has not been addressed. To fully utilize an integrated piezoelectric transducer, this work alters the layout of the piezoelectric layer to maximize both the deflection of the cantilever and measured piezoelectric charge response for a given mode with respect to the spatial distribution of the strain. On a prototype cantilever design, significant increases in actuator and sensor sensitivities were achieved for the first four modes without any substantial increase in sensor noise. The transduction mechanism is specifically targeted at multifrequency AFM and has the potential to provide higher resolution imaging on higher order modes. PMID:28326225

  14. Serial weighting of micro-objects with resonant microchanneled cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-01

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples.

  15. Compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry Joseph

    2006-08-15

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  16. The Emergence of AFM Applications to Cell Biology: How new technologies are facilitating investigation of human cells in health and disease at the nanoscale.

    PubMed

    Yang, Ruiguo; Xi, Ning; Fung, Carmen Kar Man; Seiffert-Sinha, Kristina; Lai, King Wai Chiu; Sinha, Animesh A

    2011-01-01

    Atomic Force Microscopy (AFM) based nanorobotics has been used for building nano devices in semiconductors for almost a decade. Leveraging the unparallel precision localization capabilities of this technology, high resolution imaging and mechanical property characterization is now increasingly being performed in biological settings. AFM also offers the prospect for handling and manipulating biological materials at nanometer scale. It has unique advantages over other methods, permitting experiments in the liquid phase where physiological conditions can be maintained. Taking advantage of these properties, our group has visualized membrane and cytoskeletal structures of live cells by controlling the interaction force of the AFM tip with cellular components at the nN or sub-nN range. Cell stiffness changes were observed by statistically analyzing the Young's modulus values of human keratinocytes before and after specific antibody treatment. Furthermore, we used the AFM cantilever as a robotic arm for mechanical pushing, pulling and cutting to perform nanoscale manipulations of cell-associated structures. AFM guided nano-dissection, or nanosurgery was enacted on the cell in order to sever intermediate filaments connecting neighboring keratinocytes via sub 100 nm resolution cuts. Finally, we have used a functionalized AFM tip to probe cell surface receptors to obtain binding force measurements. This technique formed the basis for Single Molecule Force Spectroscopy (SMFS). In addition to enhancing our basic understanding of dynamic signaling events in cell biology, these advancements in AFM based biomedical investigations can be expected to facilitate the search for biomarkers related to disease diagnosis progress and treatment.

  17. Cantilever tilt causing amplitude related convolution in dynamic mode atomic force microscopy.

    PubMed

    Wang, Chunmei; Sun, Jielin; Itoh, Hiroshi; Shen, Dianhong; Hu, Jun

    2011-01-01

    It is well known that the topography in atomic force microscopy (AFM) is a convolution of the tip's shape and the sample's geometry. The classical convolution model was established in contact mode assuming a static probe, but it is no longer valid in dynamic mode AFM. It is still not well understood whether or how the vibration of the probe in dynamic mode affects the convolution. Such ignorance complicates the interpretation of the topography. Here we propose a convolution model for dynamic mode by taking into account the typical design of the cantilever tilt in AFMs, which leads to a different convolution from that in contact mode. Our model indicates that the cantilever tilt results in a dynamic convolution affected by the absolute value of the amplitude, especially in the case that corresponding contact convolution has sharp edges beyond certain angle. The effect was experimentally demonstrated by a perpendicular SiO(2)/Si super-lattice structure. Our model is useful for quantitative characterizations in dynamic mode, especially in probe characterization and critical dimension measurements.

  18. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid.

    PubMed

    Akrami, Seyed Mohammad Reza; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-01

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  19. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid

    SciTech Connect

    Reza Akrami, Seyed Mohammad; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-15

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  20. Microrheology using a custom-made AFM

    NASA Astrophysics Data System (ADS)

    Kosgodagan Acharige, Sebastien; Benzaquen, Michael; Steinberger, Audrey

    In the past few years, a new method was developed to measure local properties of liquids (X. Xiong et al., Phys. Rev. E 80, 2009). This method consists of gluing a micron-sized glass fiber at the tip of an AFM cantilever and probing the liquid with it. In ENS Lyon, this method was perfected (C. Devailly et al., EPL, 106 5, 2014) with the help of an interferometer developped in the same laboratory (L. Bellon et al., Opt. Commun. 207 49, 2002 and P. Paolino et al., Rev. Sci. Instrum. 84, 2013), which background noise can reach 10-14 m /√{ Hz } . This method allows us to measure a wide range of viscosities (1 mPa . s to 500 mPa . s) of transparent and opaque fluids using a small sample volume ( 5 mL). In this presentation, I will briefly describe the interferometer developped in ENS Lyon, then explain precisely the microrheology measurements and then compare the experimental results to a model developped by M. Benzaquen. This work is supported financially by the ANR project NANOFLUIDYN (Grant Number ANR-13-BS10-0009).

  1. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    SciTech Connect

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  2. Understanding interferometry for micro-cantilever displacement detection

    PubMed Central

    Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Summary Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber–cantilever configurations. In the Fabry–Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. PMID:27547601

  3. Understanding interferometry for micro-cantilever displacement detection.

    PubMed

    von Schmidsfeld, Alexander; Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions.

  4. Periodic Charging of Individual Molecules Coupled to the Motion of an Atomic Force Microscopy Tip.

    PubMed

    Kocić, N; Weiderer, P; Keller, S; Decurtins, S; Liu, S-X; Repp, J

    2015-07-08

    Individual molecules at the edges of self-assembled islands grown on Ag(111) can be deliberately switched in their charge state with the electric field from a scanning-probe tip. Close to the threshold voltage for a charge state transition, periodic switching of the charge is directly driven by the cantilever motion in frequency-modulated atomic force microscopy (AFM), as can be deduced from the signature in the measured frequency shift. In this regime, the integrated frequency shift yields the tip-sample force that is due to a single additional electron. Further, the signature of the dynamic charging response provides information on the electronic coupling of the molecule to the substrate. In analogy to previous experiments on quantum dots, this may also be used in the future to access excited state properties of single molecules from AFM experiments.

  5. Bi-stability of amplitude modulation AFM in air: deterministic and stochastic outcomes for imaging biomolecular systems.

    PubMed

    Santos, Sergio; Barcons, Victor; Font, Josep; Thomson, Neil H

    2010-06-04

    The dynamics of the oscillating microcantilever for amplitude modulation atomic force microscopy (AM AFM) operating in air is well understood theoretically but the experimental outcomes are still emerging. We use double-stranded DNA on mica as a model biomolecular system for investigating the connection between theory and experiment. A demonstration that the switching between the two cantilever oscillation states is stochastic in nature is achieved, and it can be induced by means of topographical anomalies on the surface. Whether one or the other attractor basin is accessed depends on the tip-sample separation history used to achieve the imaging conditions, and we show that the behaviour is reproducible when the tip is stable and well characterized. Emergence of background noise occurs in certain regions of parameter space regardless of whether two cantilever oscillation states coexist. The low state has been explored in detail and we note that at low to intermediate values of the free amplitude, noise-free imaging is achieved. The outcomes shown here are general and demonstrate that a thorough and systematic experimental approach in conjunction with standard modelling gives insight into the mechanisms behind image contrast formation in AM AFM in air.

  6. Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

    SciTech Connect

    Wagner, Ryan; Raman, Arvind; Proksch, Roger

    2013-12-23

    Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

  7. Interaction of the Hydrophobic Tip of an Atomic Force Microscope with Oligopeptides Immobilized Using Short and Long Tethers.

    PubMed

    Ma, C Derek; Acevedo-Vélez, Claribel; Wang, Chenxuan; Gellman, Samuel H; Abbott, Nicholas L

    2016-03-29

    We report an investigation of the adhesive force generated between the hydrophobic tip of an atomic force microscope (AFM) and surfaces presenting oligopeptides immobilized using either short (∼1 nm) or long (∼60 nm) tethers. Specifically, we used either sulfosuccinimidyl-4-(N-maleimidomethyl)cyclohexane-1-carboxylate (SSMCC) or 10 kDa polyethylene glycol (PEG) end-functionalized with maleimide and N-hydroxysuccinimide groups to immobilize helical oligomers of β-amino acids (β-peptides) to mixed monolayers presenting tetraethylene glycol (EG4) and amine-terminated EG4 (EG4N) groups. When SSMCC was used to immobilize the β-peptides, we measured the adhesive interaction between the AFM tip and surface to rupture through a single event with magnitude consistent with the interaction of a single β-peptide with the AFM tip. Surprisingly, this occurred even when, on average, multiple β-peptides were located within the interaction area between the AFM tip and surface. In contrast, when using the long 10 kDa PEG tether, we observed the magnitude of the adhesive interaction as well as the dynamics of the rupture events to unmask the presence of the multiple β-peptides within the interaction area. To provide insight into these observations, we formulated a simple mechanical model of the interaction of the AFM tip with the immobilized β-peptides and used the model to demonstrate that adhesion measurements performed using short tethers (but not long tethers) are dominated by the interaction of single β-peptides because (i) the mechanical properties of the short tether are highly nonlinear, thus causing one β-peptide to dominate the adhesion force at the point of rupture, and (ii) the AFM cantilever is mechanically unstable following the rupture of the adhesive interaction with a single β-peptide. Overall, our study reveals that short tethers offer the basis of an approach that facilitates measurement of adhesive interactions with single molecules presented at

  8. Adaptive control of force microscope cantilever dynamics

    NASA Astrophysics Data System (ADS)

    Jensen, S. E.; Dougherty, W. M.; Garbini, J. L.; Sidles, J. A.

    2007-09-01

    Magnetic resonance force microscopy (MRFM) and other emerging scanning probe microscopies entail the detection of attonewton-scale forces. Requisite force sensitivities are achieved through the use of soft force microscope cantilevers as high resonant-Q micromechanical oscillators. In practice, the dynamics of these oscillators are greatly improved by the application of force feedback control computed in real time by a digital signal processor (DSP). Improvements include increased sensitive bandwidth, reduced oscillator ring up/down time, and reduced cantilever thermal vibration amplitude. However, when the cantilever tip and the sample are in close proximity, electrostatic and Casimir tip-sample force gradients can significantly alter the cantilever resonance frequency, foiling fixed-gain narrow-band control schemes. We report an improved, adaptive control algorithm that uses a Hilbert transform technique to continuously measure the vibration frequency of the thermally-excited cantilever and seamlessly adjust the DSP program coefficients. The closed-loop vibration amplitude is typically 0.05 nm. This adaptive algorithm enables narrow-band formally-optimal control over a wide range of resonance frequencies, and preserves the thermally-limited signal to noise ratio (SNR).

  9. Grating Loaded Cantilevers for Displacement Measurements

    NASA Astrophysics Data System (ADS)

    Karademir, Ertugrul; Olcum, Selim; Atalar, Abdullah; Aydinli, Atilla

    2010-03-01

    A cantilever with a grating coupler engraved on its tip is used for measuring displacement. The coupled light in the cantilever is guided to a single mode optical waveguide defined at the base of the cantilever. The grating period is 550 nm and is fabricated on a SOI wafer using nanoimprint lithography. The waveguide and the cantilever are defined by an RIE and cantilevers released by KOH and HF solutions. Light with 1550 nm wavelength, is directed onto the grating coupler and detected at the cleaved end of the SOI waveguide. The angle of incidence is controlled by a motorized rotary stage. Light couples into the waveguide at a characteristic angle with a full width at half maximum of approximately 6.9 mrads translating into a Q factor of 87.5. The displacement sensitivity is measured by driving the cantilever with a frequency controlled piezoelectric element. The modulation of the light at the waveguide output is lock-in detected by a biased infrared detector. The resulting 43%mrad-1 sensitivity can be increased with further optimization.

  10. Cantilever spring constant calibration using laser Doppler vibrometry

    SciTech Connect

    Ohler, Benjamin

    2007-06-15

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  11. Cantilever spring constant calibration using laser Doppler vibrometry.

    PubMed

    Ohler, Benjamin

    2007-06-01

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  12. On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids

    SciTech Connect

    Kiracofe, Daniel; Raman, Arvind

    2010-02-15

    The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated by measuring the vibrations of such microcantilevers in air and water using a scanning laser Doppler vibrometer. It is found that for rectangular tipless microcantilevers, the measured fundamental and higher eigenmodes and their equivalent stiffnesses are nearly identical in air and in water. However, for microcantilevers with a tip mass or for picket shaped cantilevers, there is a marked difference in the second (and higher) eigenmode shapes between air and water that leads to a large decrease in their modal stiffness in water as compared to air as well as a decrease in their optical lever sensitivity. These results are explained in terms of hydrodynamic interactions of microcantilevers with nonuniform mass distribution. The results clearly demonstrate that tip mass and hydrodynamic loading must be taken into account in stiffness calibration and optical lever sensitivity calibration while using higher-order eigenmodes in dynamic AFM.

  13. The Emergence of AFM Applications to Cell Biology: How new technologies are facilitating investigation of human cells in health and disease at the nanoscale

    PubMed Central

    Yang, Ruiguo; Xi, Ning; Fung, Carmen Kar Man; Seiffert-Sinha, Kristina; Lai, King Wai Chiu; Sinha, Animesh A.

    2013-01-01

    Atomic Force Microscopy (AFM) based nanorobotics has been used for building nano devices in semiconductors for almost a decade. Leveraging the unparallel precision localization capabilities of this technology, high resolution imaging and mechanical property characterization is now increasingly being performed in biological settings. AFM also offers the prospect for handling and manipulating biological materials at nanometer scale. It has unique advantages over other methods, permitting experiments in the liquid phase where physiological conditions can be maintained. Taking advantage of these properties, our group has visualized membrane and cytoskeletal structures of live cells by controlling the interaction force of the AFM tip with cellular components at the nN or sub-nN range. Cell stiffness changes were observed by statistically analyzing the Young’s modulus values of human keratinocytes before and after specific antibody treatment. Furthermore, we used the AFM cantilever as a robotic arm for mechanical pushing, pulling and cutting to perform nanoscale manipulations of cell-associated structures. AFM guided nano-dissection, or nanosurgery was enacted on the cell in order to sever intermediate filaments connecting neighboring keratinocytes via sub 100 nm resolution cuts. Finally, we have used a functionalized AFM tip to probe cell surface receptors to obtain binding force measurements. This technique formed the basis for Single Molecule Force Spectroscopy (SMFS). In addition to enhancing our basic understanding of dynamic signaling events in cell biology, these advancements in AFM based biomedical investigations can be expected to facilitate the search for biomarkers related to disease diagnosis progress and treatment. PMID:24416719

  14. Technology for fabrication of a micromagnet on a tip of a MFM/MRFM probe

    DOEpatents

    Pelekhov, Denis V.; Hammel, P. Chris; Nunes, Jr., Geoffrey; Midzor, Melissa M.; Roukes, Michael

    2004-01-13

    A method for coating the tip of a mechanical resonator for use in magnetic force microscopy and magnetic resonance force microscopy in which the tip is coated with a ferromagnetic material and the cantilever is not, and the product resulting from the method. A cantilever and incorporated tip are coated with a photoresist, except that surface tension keeps photoresist off the tip. The cantilever and tip are then coated with a magnetic material. Next, acetone is used to lift off the magnetic material from the cantilever but not from the tip.

  15. Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM.

    PubMed

    Kuchuk, Kfir; Sivan, Uri

    2015-01-01

    The nonlinear interaction between an AFM tip and a sample gives rise to oscillations of the cantilever at integral multiples (harmonics) of the fundamental resonance frequency. The higher order harmonics have long been recognized to hold invaluable information on short range interactions but their utilization has thus far been relatively limited due to theoretical and experimental complexities. In particular, existing approximations of the interaction force in terms of higher harmonic amplitudes generally require simultaneous measurements of multiple harmonics to achieve satisfactory accuracy. In the present letter we address the mathematical challenge and derive accurate, explicit formulae for both conservative and dissipative forces in terms of an arbitrary single harmonic. Additionally, we show that in frequency modulation-AFM (FM-AFM) each harmonic carries complete information on the force, obviating the need for multi-harmonic analysis. Finally, we show that higher harmonics may indeed be used to reconstruct short range forces more accurately than the fundamental harmonic when the oscillation amplitude is small compared with the interaction range.

  16. Comparative AFM nanoscratching tests in air of bulk copper and electrogenerated cuprous oxide films

    NASA Astrophysics Data System (ADS)

    Chaal, Lila; Debiemme-Chouvy, Catherine; Deslouis, Claude; Maurin, Georges; Pailleret, Alain; Saidani, Boualem

    2011-01-01

    The normal and lateral spring constants of rectangular silicon AFM cantilevers bearing pyramidal silicon tips were accurately calibrated using a procedure that takes into account their tilt compared to horizontal orientation and their trapezoidal cross section. Such systems were used to carry out nanoscratching tests in air on technical substrates presenting a moderate roughness (RMS ≈ 40 nm) and made either from bulk copper or from cuprous oxide thin films electrogenerated on copper. The various events occurring during these nanoscratching procedures were characterized in details. In particular, the features of the scars appearing on the scratched zones and SEM observations of the AFM tips used during the nanoscratching procedures are described and exploited to establish a better understanding of the effects of the nanoscratching procedures on the targeted samples. In the case of electrodeposited Cu 2O films, these effects are discussed with the help of chemical and structural characterizations using XPS and XRD studies. All this set of information is used i) to describe the history of the nanoscratching tests and ii) to compare mechanical resistance of bulk copper and electrogenerated Cu 2O thin films using these nanoscratching tests carried out in air. The wear mechanism occurring during nanoscratching tests is discussed for both kinds of samples and compared with the one observed during erosion in erosion-corrosion tests.

  17. Quantitative probing of tip-induced local cooling with a resistive nanoheater/thermometer

    NASA Astrophysics Data System (ADS)

    Hamian, Sina; Yun, Jeonghoon; Park, Inkyu; Park, Keunhan

    2016-12-01

    This article reports the investigation of tip-induced local cooling when an atomic force microscope (AFM) cantilever tip scans over a joule-heated Pt nanowire. We fabricated four-point-probe Pt resistive nanothermometers having a sensing area of 250 nm × 350 nm by combining electron-beam lithography and photolithography. The electrical resistance of a fabricated nanothermometer is ˜27.8 Ω at room temperature and is linearly proportional to the temperature increase up to 350 K. The equivalent temperature coefficient of resistance is estimated to be (7.0 ±0.1 )×10-4 K-1. We also joule-heated a nanothermometer to increase its sensing area temperature up to 338.5 ± 0.2 K, demonstrating that the same device can be used as a nanoheater. An AFM probe tip scanning over a heated nanoheater/thermometer's sensing area induces local cooling due to heat conduction through solid-solid contact, water meniscus, and surrounding air. The effective contact thermal conductance is 32.5 ± 0.8 nW/K. These results contribute to the better understanding of tip-substrate thermal interactions, which is the fundamental subject in tip-based thermal engineering applications.

  18. Multi-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experiment

    SciTech Connect

    Boularas, A. Baudoin, F.; Villeneuve-Faure, C.; Clain, S.; Teyssedre, G.

    2014-08-28

    Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis of stored charge quantities, measurements using an Atomic Force Microscope (AFM) must go with an appropriate simulation of electrostatic forces at play in the method. This is the objective of this work, where simulation results for the electrostatic force between an AFM sensor and the dielectric surface are presented for different bias voltages on the tip. The aim is to analyse force-distance curves modification induced by electrostatic charges. The sensor is composed by a cantilever supporting a pyramidal tip terminated by a spherical apex. The contribution to force from cantilever is neglected here. A model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator—PRO-scheme. First results of the computation of electrostatic force for different tip–sample distances (from 0 to 600 nm) and for different DC voltages applied to the tip (6 to 20 V) are shown and compared with experimental data in order to validate our approach.

  19. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

    SciTech Connect

    Chung, Koo-Hyun; Reitsma, Mark G.

    2010-02-15

    This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

  20. Anomalies in nanostructure size measurements by AFM

    NASA Astrophysics Data System (ADS)

    Mechler, Ádám; Kopniczky, Judit; Kokavecz, János; Hoel, Anders; Granqvist, Claes-Göran; Heszler, Peter

    2005-09-01

    Anomalies in atomic force microscopy (AFM) based size determination of nanoparticles were studied via comparative analysis of experiments and numerical calculations. Single tungsten oxide nanoparticles with a mean diameter of 3nm were deposited on mica and graphite substrates and were characterised by AFM. The size (height) of the nanoparticles, measured by tapping mode AFM, was found to be sensitive to the free amplitude of the oscillating tip, thus indicating that the images were not purely topographical. By comparing the experimental results to model calculations, we demonstrate that the dependence of the nanoparticle size on the oscillation amplitude of the tip is an inherent characteristic of the tapping mode AFM; it is also a function of physical properties such as elasticity and surface energy of the nanoparticle and the sample surface, and it depends on the radius of curvature of the tip. We show that good approximation of the real size can easily be obtained from plots of particle height vs free amplitude of the oscillating tip, although errors might persist for individual experiments. The results are valid for size (height) determination of any nanometer-sized objects imaged by tapping mode AFM.

  1. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    PubMed

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  2. Fabrication of wear-resistant silicon microprobe tips for high-speed surface roughness scanning devices

    NASA Astrophysics Data System (ADS)

    Wasisto, Hutomo Suryo; Yu, Feng; Doering, Lutz; Völlmeke, Stefan; Brand, Uwe; Bakin, Andrey; Waag, Andreas; Peiner, Erwin

    2015-05-01

    Silicon microprobe tips are fabricated and integrated with piezoresistive cantilever sensors for high-speed surface roughness scanning systems. The fabrication steps of the high-aspect-ratio silicon microprobe tips were started with photolithography and wet etching of potassium hydroxide (KOH) resulting in crystal-dependent micropyramids. Subsequently, thin conformal wear-resistant layer coating of aluminum oxide (Al2O3) was demonstrated on the backside of the piezoresistive cantilever free end using atomic layer deposition (ALD) method in a binary reaction sequence with a low thermal process and precursors of trimethyl aluminum and water. The deposited Al2O3 layer had a thickness of 14 nm. The captured atomic force microscopy (AFM) image exhibits a root mean square deviation of 0.65 nm confirming the deposited Al2O3 surface quality. Furthermore, vacuum-evaporated 30-nm/200-nm-thick Au/Cr layers were patterned by lift-off and served as an etch mask for Al2O3 wet etching and in ICP cryogenic dry etching. By using SF6/O2 plasma during inductively coupled plasma (ICP) cryogenic dry etching, micropillar tips were obtained. From the preliminary friction and wear data, the developed silicon cantilever sensor has been successfully used in 100 fast measurements of 5- mm-long standard artifact surface with a speed of 15 mm/s and forces of 60-100 μN. Moreover, the results yielded by the fabricated silicon cantilever sensor are in very good agreement with those of calibrated profilometer. These tactile sensors are targeted for use in high-aspect-ratio microform metrology.

  3. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

    PubMed Central

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian

    2016-01-01

    Summary We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  4. A Weed Cantilever

    ERIC Educational Resources Information Center

    Keller, Elhannan L.; Padalino, John

    1977-01-01

    Describes the Environmental Action Task activity, which may be used as a recreational game or an environmental perception experience, may be conducted indoors or out-of-doors, using weed stems (or spaghetti) and masking tape to construct a cantilever. Small groups of children work together to make the cantilever with the longest arm. Further…

  5. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    NASA Astrophysics Data System (ADS)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  6. Shear force microscopy using piezoresistive cantilevers in surface metrology

    NASA Astrophysics Data System (ADS)

    Gotszalk, Teodor; Kopiec, Daniel; Sierakowski, Andrzej; Janus, Paweł; Grabiec, Piotr; Rangelow, Ivo W.

    2014-09-01

    In this article we describe application of piezoresistive cantilevers in surface investigations carried out with the use of shear force microscopy (ShFM). The novel piezoresistive cantilevers integrate a Wheatstone piezoresistive bridge was used to detect the cantilever deflection, thermal deflection detector and planar tip protruding out of the spring beam. Because the planar tip deflection can be detected and controlled electronically the described technology is very flexible and can be applied in many surface investigations. In this article we will present operation theory of the described solution, experimental setup, methods for calibration of the tip deflection detection and actuation The analysis will be illustrated with example results of topography measurements performed using the described technology.

  7. Lateral force microscope calibration using a modified atomic force microscope cantilever

    SciTech Connect

    Reitsma, M. G.

    2007-10-15

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.

  8. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy.

    PubMed

    Loganathan, Muthukumaran; Bristow, Douglas A

    2014-04-01

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  9. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  10. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    PubMed

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.

  11. Nanomechanical Cantilever Array Sensors

    NASA Astrophysics Data System (ADS)

    Lang, Hans; Hegner, Martin; Gerber, Christoph

    Microfabricated cantilever sensors have attracted much interest in recent years as devices for the fast and reliable detection of small concentrations of molecules in air and solution. In addition to application of such sensors for gas and chemical-vapor sensing, for example as an artificial nose, they have also been employed to measure physical properties of tiny amounts of materials in miniaturized versions of conventional standard techniques such as calorimetry, thermogravimetry, weighing, photothermal spectroscopy, as well as for monitoring chemical reactions such as catalysis on small surfaces. In the past few years, the cantilever-sensor concept has been extended to biochemical applications and as an analytical device for measurements of biomaterials. Because of the label-free detection principle of cantilever sensors, their small size and scalability, this kind of device is advantageous for diagnostic applications and disease monitoring, as well as for genomics or proteomics purposes. The use of microcantilever arrays enables detection of several analytes simultaneously and solves the inherent problem of thermal drift often present when using single microcantilever sensors, as some of the cantilevers can be used as sensor cantilevers for detection, and other cantilevers serve as passivated reference cantilevers that do not exhibit affinity to the molecules to be detected.

  12. Understanding the plasmonics of nanostructured atomic force microscopy tips

    NASA Astrophysics Data System (ADS)

    Sanders, A.; Bowman, R. W.; Zhang, L.; Turek, V.; Sigle, D. O.; Lombardi, A.; Weller, L.; Baumberg, J. J.

    2016-10-01

    Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy, with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local optical response of sharp and spherical-tipped atomic force microscopy (AFM) tips using a scanning hyperspectral imaging technique to identify the plasmonic behaviour. Localised surface plasmon resonances which radiatively couple with far-field light are found only for spherical AFM tips, with little response for sharp AFM tips, in agreement with numerical simulations of the near-field response. The precise tip geometry is thus crucial for plasmon-enhanced spectroscopies, and the typical sharp cones are not preferred.

  13. Tuning the Spring Constant of Cantilever-free Probe Arrays

    NASA Astrophysics Data System (ADS)

    Eichelsdoerfer, Daniel J.; Brown, Keith A.; Boya, Radha; Shim, Wooyoung; Mirkin, Chad A.

    2013-03-01

    The versatility of atomic force microscope (AFM) based techniques such as scanning probe lithography is due in part to the utilization of a cantilever that can be fabricated to match a desired application. In contrast, cantilever-free scanning probe lithography utilizes a low cost array of probes on a compliant backing layer that allows for high throughput nanofabrication but lacks the tailorability afforded by the cantilever in traditional AFM. Here, we present a method to measure and tune the spring constant of probes in a cantilever-free array by adjusting the mechanical properties of the underlying elastomeric layer. Using this technique, we are able to fabricate large-area silicon probe arrays with spring constants that can be tuned in the range from 7 to 150 N/m. This technique offers an advantage in that the spring constant depends linearly on the geometry of the probe, which is in contrast to traditional cantilever-based lithography where the spring constant varies as the cube of the beam width and thickness. To illustrate the benefit of utilizing a probe array with a lower spring constant, we pattern a block copolymer on a delicate 50 nm thick silicon nitride window.

  14. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  15. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    SciTech Connect

    Baumann, Fabian; Pippig, Diana A. Gaub, Hermann E.; Heucke, Stephan F.

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  16. Calibration of higher eigenmodes of cantilevers

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

  17. Multi-directional energy harvesting by piezoelectric cantilever-pendulum with internal resonance

    SciTech Connect

    Xu, J.; Tang, J.

    2015-11-23

    This letter reports a piezoelectric cantilever-pendulum design for multi-directional energy harvesting. A pendulum is attached to the tip of a piezoelectric cantilever-type energy harvester. This design aims at taking advantage of the nonlinear coupling between the pendulum motion in 3-dimensional space and the beam bending vibration at resonances. Experimental studies indicate that, under properly chosen parameters, 1:2 internal resonance can be induced, which enables the multi-directional energy harvesting with a single cantilever. The advantages of the design with respect to traditional piezoelectric cantilever are examined.

  18. Use of self-actuating and self-sensing cantilevers for imaging biological samples in fluid

    PubMed Central

    Barbero, R J; Deutschinger, A; Todorov, V; Gray, D S; Belcher, A M; Rangelow, I W; Youcef-Toumi, K

    2014-01-01

    In this paper, we present a detailed investigation into the suitability of atomic force microscopy (AFM) cantilevers with integrated deflection sensor and micro-actuator for imaging of soft biological samples in fluid. The Si cantilevers are actuated using a micro-heater at the bottom end of the cantilever. Sensing is achieved through p-doped resistors connected in a Wheatstone bridge. We investigated the influence of the water on the cantilever dynamics, the actuation and the sensing mechanisms, as well as the crosstalk between sensing and actuation. Successful imaging of yeast cells in water using the integrated sensor and actuator shows the potential of the combination of this actuation and sensing method. This constitutes a major step towards the automation and miniaturization required to establish AFM in routine biomedical diagnostics and in vivo applications. PMID:19801750

  19. Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy

    NASA Astrophysics Data System (ADS)

    Olson, Stephen; Sankaran, Balasubramanian; Altemus, Bruce; Xu, Bai; Geer, Robert

    2005-05-01

    Although the conventional optical lever technology typically used for scanning probe microscope applications has proven highly sensitive, accurate, and cost effective for most applications involving micromachined cantilever deflection measurements, frequency limitations and space needs limit its applicability to emerging ultrasonic-based SPM applications. Recently, the fabrication of cantilevers integrated with actuation and sensing components has opened avenues for feedback-based driving of micromachined cantilevers at higher-order resonance frequencies while sensing average deflection without the need for an optical deflection pathway for average deflection sensing. The work presented here will review recent efforts by our group in fabricating micromachined cantilevers with integrated piezoresistive deflection-sensing components combined with integrated ZnO actuation layers to induce cantilever deflection. These cantilevers are being fabricated for use in a heterodyne force microscopy system (HFM) to enable SPM imaging contrast based on viscoelastic response of a surface in contact with a micromachined tip wherein active-feedback technology is being applied to maintain ultrasonic tip excitation at higher order cantilever resonances. The first and second-pass fabrication results will be presented and reviewed regarding cantilever release and ZnO actuator (and electrode) fabrication. Dynamic response data from these structures, measured via laser Doppler vibrometery reveal the expected resonance structure for a cantilever of these dimensions.

  20. AFM Structural Characterization of Drinking Water Biofilm ...

    EPA Pesticide Factsheets

    Due to the complexity of mixed culture drinking water biofilm, direct visual observation under in situ conditions has been challenging. In this study, atomic force microscopy (AFM) revealed the three dimensional morphology and arrangement of drinking water relevant biofilm in air and aqueous solution. Operating parameters were optimized to improve imaging of structural details for a mature biofilm in liquid. By using a soft cantilever (0.03 N/m) and slow scan rate (0.5 Hz), biofilm and individual bacterial cell’s structural topography were resolved and continuously imaged in liquid without loss of spatial resolution or sample damage. The developed methodology will allow future in situ investigations to temporally monitor mixed culture drinking water biofilm structural changes during disinfection treatments. Due to the complexity of mixed culture drinking water biofilm, direct visual observation under in situ conditions has been challenging. In this study, atomic force microscopy (AFM) revealed the three dimensional morphology and arrangement of drinking water relevant biofilm in air and aqueous solution. Operating parameters were optimized to improve imaging of structural details for a mature biofilm in liquid. By using a soft cantilever (0.03 N/m) and slow scan rate (0.5 Hz), biofilm and individual bacterial cell’s structural topography were resolved and continuously imaged in liquid without loss of spatial resolution or sample damage. The developed methodo

  1. Parametric effects in nanobeams and AFM

    SciTech Connect

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-10

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  2. Method for providing a compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo M.; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry J.

    2008-12-16

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  3. Wetting properties of AFM probes by means of contact angle measurement

    NASA Astrophysics Data System (ADS)

    Tao, Zhenhua; Bhushan, Bharat

    2006-09-01

    An atomic force microscopy (AFM) based technique was developed to measure the wetting properties of probe tips. By advancing and receding the AFM tip across the water surface, the meniscus force between the tip and the liquid was measured at the tip-water separation. The water contact angle was determined from the meniscus force. The obtained contact angle results were compared with that by the sessile drop method. It was found that the AFM based technique provided higher contact angle values than the sessile drop method. The mechanisms responsible for the difference are discussed.

  4. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations.

  5. Defect reduction in gallium nitride using cantilever epitaxy.

    SciTech Connect

    Mitchell, Christine Charlotte

    2003-08-01

    Cantilever epitaxy (CE) has been developed to produce GaN on sapphire with low dislocation densities as needed for improved devices. The basic mechanism of seeding growth on sapphire mesas and lateral growth of cantilevers until they coalesce has been modified with an initial growth step at 950 C. This step produces a gable with (11{bar 2}2) facets over the mesas, which turns threading dislocations from vertical to horizontal in order to reduce the local density above mesas. This technique has produced material with densities as low as 2-3x10{sup 7}/cm{sup 2} averaged across extended areas of GaN on sapphire, as determined with AFM, TEM and cathodoluminescence (CL). This density is about two orders of magnitude below that of conventional planar growths; these improvements suggest that locating wide-area devices across both cantilever and mesa regions is possible. However, the first implementation of this technique also produced a new defect: cracks at cantilever coalescences with associated arrays of lateral dislocations. These defects have been labeled 'dark-block defects' because they are non-radiative and appear as dark rectangles in CL images. Material has been grown that does not have dark-block defects. Examination of the evolution of the cantilever films for many growths, both partial and complete, indicates that producing a film without these defects requires careful control of growth conditions and crystal morphology at multiple steps. Their elimination enhances optical emission and uniformity over large (mm) size areas.

  6. Analytical solutions of the first three frequency shifts of AFM non-uniform probe subjected to the Lennard-Jones force.

    PubMed

    Lin, Shueei-Muh; Liauh, Chihng-Tsung; Wang, Wen-Rong; Ho, Shing-Huei

    2006-04-01

    The role of higher cantilever modes is important to obtain some material contrast. The analysis of AFM subjected to a short-range force can improve greatly the studies of surface topography and interaction energies and interaction forces, especially for chemical and biological materials. When the tip-sample distance is in the order of inter-atomic spacing, the short-range tip-sample force is usually simulated by the Lennard-Jones model. In this study, the analytical method to determine the frequency shift of AFM subjected to the Lennard-Jones force is proposed. The closed-form solution of the partial differential equation with a nonlinear boundary condition is derived and then the corresponding frequency shifts of higher modes can be determined easily. Moreover, the conventional perturbation method is usually used to determine the frequency shift, but only for the first mode. This is because the original continuous beam system is transformed into a discrete lumped-masses model. Although the above disadvantages exist, the lumped-masses model is simple and intuitive. Using the principle of dynamic strain energy, the conventional perturbation method is revised successfully to determine the frequency shifts of higher modes. The assessment of the generalized perturbation method and the proposed method is made. Finally, the effects of several parameters on the first three frequency shifts are investigated.

  7. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied – in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry – neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  8. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.

    PubMed

    Sader, John E; Lu, Jianing; Mulvaney, Paul

    2014-11-01

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied - in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry - neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  9. Measurement of Mechanical Properties of Cantilever Shaped Materials

    PubMed Central

    Finot, Eric; Passian, Ali; Thundat, Thomas

    2008-01-01

    Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to a differential stress can all be simultaneously determined for a cantilever. When measuring the mechanical properties of materials, identifying and discerning the most influential parameters responsible for the observed changes in the cantilever response are important. We will, therefore, discuss the effects of various force fields such as those induced by mass loading, residual stress, internal friction of the material, and other changes in the mechanical properties of the microcantilevers. Methods to measure variations in temperature, pressure, or molecular adsorption of water molecules are also discussed. Often these effects occur simultaneously, increasing the number of parameters that need to be concurrently measured to ensure the reliability of the sensors. We therefore systematically investigate the geometric and environmental effects on cantilever measurements including the chemical nature of the underlying interactions. To address the geometric effects we have considered cantilevers with a rectangular or circular cross section. The chemical nature is addressed by using cantilevers fabricated with metals and/or dielectrics. Selective chemical etching, swelling or changes in Young's modulus of the surface were investigated by means of polymeric and inorganic coatings. Finally to address the effect of the environment in which the cantilever operates, the Knudsen number was determined to characterize the molecule-cantilever collisions. Also bimaterial cantilevers with high thermal sensitivity were used to discern the effect of temperature variations. When appropriate

  10. Ultrasensitive Silicon Cantilever for Force Microscopy

    NASA Astrophysics Data System (ADS)

    Stowe, Timothy; Yasumura, Kevin; Thomas, Kenny; Daniel, Rugar

    1996-03-01

    A new type of ultrasensitive high Q scanning force probe has been developed which is capable of measuring forces smaller than 10-16 N in vacuum at a few degK. These single crystal silicon probes are 500 Åto 1700 Åthick and have in-plane tips with a radius of curvature under 90 nm. Because of their low spring constant (10-4 N/m) these cantilevers were placed normal to the sample surface thereby avoiding tip crashes due to snap in and were vibrated in the pendulum mode. Cantilever amplitude was detected using a fiber interferometer. Measurements of the Q vs. distance from sample surfaces in vacuum and nonlinear effects have been obtained. Measurements Q vs. temperature and ways of improving the Q will be discussed. This scanning force probe may be used to extend the spatial resolution and force sensitivity of Magnetic Resonance Force Microscopy. This research has been partially supported by the Fannie-Hertz Foundation.

  11. AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging.

    PubMed

    Dazzi, Alexandre; Prater, Craig B

    2016-12-13

    Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the spatial resolution of AFM in combination with the chemical analysis and compositional imaging capabilities of infrared spectroscopy. This article briefly reviews the development and underlying technology of AFM-IR, including recent advances, and then surveys a wide range of applications and investigations using AFM-IR. AFM-IR applications that will be discussed include those in polymers, life sciences, photonics, solar cells, semiconductors, pharmaceuticals, and cultural heritage. In the Supporting Information , the authors provide a theoretical section that reviews the physics underlying the AFM-IR measurement and detection mechanisms.

  12. AFM imaging of fenestrated liver sinusoidal endothelial cells.

    PubMed

    Braet, F; Wisse, E

    2012-12-01

    Each microscope with its dedicated sample preparation technique provides the investigator with a specific set of data giving an instrument-determined (or restricted) insight into the structure and function of a tissue, a cell or parts thereof. Stepwise improvements in existing techniques, both instrumental and preparative, can sometimes cross barriers in resolution and image quality. Of course, investigators get really excited when completely new principles of microscopy and imaging are offered in promising new instruments, such as the AFM. The present paper summarizes a first phase of studies on the thin endothelial cells of the liver. It describes the preparation-dependent differences in AFM imaging of these cells after isolation. Special point of interest concerned the dynamics of the fenestrae, thought to filter lipid-carrying particles during their transport from the blood to the liver cells. It also describes the attempts to image the details of these cells when alive in cell cultures. It explains what physical conditions, mainly contributed to the scanning stylus, are thought to play a part in the limitations in imaging these cells. The AFM also offers promising specifications to those interested in cell surface details, such as membrane-associated structures, receptors, coated pits, cellular junctions and molecular aggregations or domains. The AFM also offers nano-manipulation possibilities, strengths and elasticity measurements, force interactions, affinity measurements, stiffness and other physical aspects of membranes and cytoskeleton. The potential for molecular approaches is there. New developments in cantilever construction and computer software promise to bring real time video imaging to the AFM. Home made accessories for the first generation of AFM are now commodities in commercial instruments and make the life of the AFM microscopist easier. Also, the combination of different microscopies, such as AFM and TEM, or AFM and SEM find their way to the

  13. A cantilever based optical fiber acoustic sensor fabricated by femtosecond laser micromachining

    NASA Astrophysics Data System (ADS)

    Liu, Jie; Yuan, Lei; Huang, Jie; Xiao, Hai

    2016-04-01

    In this paper, we present a pure silica micro-cantilever based optical fiber sensor for acoustic wave detection. The cantilever is directly fabricated by fs laser micromachining on an optical fiber tip functioning as an inline Fabry-Perot interferometer (FPI). The applied acoustic wave pressurizes the micro-cantilever beam and the corresponding dynamic signals can be probed by the FPI. The thickness, length, and width of the micro-cantilever beam can be flexibly designed and fabricated so that the sensitivity, frequency response, and the total measurement range can be varied to fit many practical applications. Experimental results will be presented and analyzed. Due to the assembly free fabrication of the fs-laser, multiple micro-cantilever beams could be potentially fabricated in/on a single optical fiber for quasi-distributed acoustic mapping with high spatial resolution.

  14. High-speed AFM of human chromosomes in liquid

    NASA Astrophysics Data System (ADS)

    Picco, L. M.; Dunton, P. G.; Ulcinas, A.; Engledew, D. J.; Hoshi, O.; Ushiki, T.; Miles, M. J.

    2008-09-01

    Further developments of the previously reported high-speed contact-mode AFM are described. The technique is applied to the imaging of human chromosomes at video rate both in air and in water. These are the largest structures to have been imaged with high-speed AFM and the first imaging in liquid to be reported. A possible mechanism that allows such high-speed contact-mode imaging without significant damage to the sample is discussed in the context of the velocity dependence of the measured lateral force on the AFM tip.

  15. Experimental investigation of fatigue in a cantilever energy harvesting beam

    NASA Astrophysics Data System (ADS)

    Avvari, Panduranga Vittal; Yang, Yaowen; Liu, Peiwen; Soh, Chee Kiong

    2015-03-01

    Over the last decade, cantilever energy harvesters gained immense popularity owing to the simplicity of the design and piezoelectric energy harvesting (PEH) using the cantilever design has undergone considerable evolution. The major drawback of a vibrating cantilever beam is its vulnerability to fatigue over a period of time. This article brings forth an experimental investigation into the phenomenon of fatigue of a PEH cantilever beam. As there has been very little literature reported in this area, an effort has been made to scrutinize the damage due to fatigue in a linear vibrating cantilever PEH beam consisting of an aluminum substrate with a piezoelectric macro-fiber composite (MFC) patch attached near the root of the beam and a tip mass attached to the beam. The beam was subjected to transverse vibrations and the behavior of the open circuit voltage was recorded with passing time. Moreover, electro-mechanical admittance readings were obtained periodically using the same MFC patch as a Structural health monitoring (SHM) sensor to assess the health of the PEH beam. The results show that with passing time the PEH beam underwent fatigue in both the substrate and MFC, which is observed in a complimentary trend in the voltage and admittance readings. The claim is further supported using the variation of root mean square deviation (RMSD) of the real part of admittance (conductance) readings. Thus, this study concludes that the fatigue issue should be addressed in the design of PEH for long term vibration energy harvesting.

  16. AFM/TIRF force clamp measurements of neurosecretory vesicle tethers reveal characteristic unfolding steps

    PubMed Central

    Harris, Mark C.; Cislo, Dillon; Lenz, Joan S.; Umbach, Christopher

    2017-01-01

    Although several proteins have been implicated in secretory vesicle tethering, the identity and mechanical properties of the components forming the physical vesicle-plasma membrane link remain unknown. Here we present the first experimental measurements of nanomechanical properties of secretory vesicle-plasma membrane tethers using combined AFM force clamp and TIRF microscopy on membrane sheets from PC12 cells expressing the vesicle marker ANF-eGFP. Application of pulling forces generated tether extensions composed of multiple steps with variable length. The frequency of short (<10 nm) tether extension events was markedly higher when a fluorescent vesicle was present at the cantilever tip and increased in the presence of GTPγS, indicating that these events reflect specifically the properties of vesicle-plasma membrane tethers. The magnitude of the short tether extension events is consistent with extension lengths expected from progressive unfolding of individual helices of the exocyst complex, supporting its direct role in forming the physical vesicle-plasma membrane link. PMID:28323853

  17. Gland With Cantilever Seal

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B.

    1989-01-01

    Single-piece gland forms tight seal on probe or tube containing liquid or gas at high pressure. Gland and probe align as assembled by simple torquing procedure. Disconnected easily and reused at same site. Made from any of wide variety of materials so compatible with application. Cantilever ring at top of gland bites into wall of tube or probe, sealing it. Wall of tube or probe must be thick enough to accommodate deformation without rupturing. Maximum deformation designed in coordination with seating and deformation of boss or conical seal.

  18. Approach to nonphotoperturbed differential capacitance measurements: A front-wing cantilever

    NASA Astrophysics Data System (ADS)

    Chang, M. N.; Chen, C. Y.; Huang, W. J.; Cheng, T. C.

    2005-07-01

    We have developed a front-wing (FW) cantilever structure that can significantly suppress photoperturbation effects during scanning capacitance microscopy (SCM) and scanning capacitance spectroscopy (SCS) measurements. The FW cantilever provides an effective shadow area that fully covers the scan region, allowing us to synchronously obtain SCM images and the corresponding topographic images without photoperturbation problems. Nonphotoperturbed differential capacitance characteristics versus tip biases were also obtained for SCS by the use of these FW cantilevers. This means that nonphotoperturbed SCM and SCS measurements can be carried out during the typical SCM operations.

  19. AFM Manipulation of Viruses: Substrate Interactions and Mechanical Properties

    NASA Astrophysics Data System (ADS)

    Falvo, M. R.; Superfine, R.; Washburn, S.; Finch, M.; Taylor, R. M.; Chi, V.; Brooks, F. P.; Ferrari, F.; Samulski, R.

    1996-03-01

    Using an AFM tip as a manipulation tool, we have translated, rotated, and dissected individual Tobacco Mosaic Virus (TMV) and Adenovirus particles. We have implemented a teleoperation system which allows manual control of the relative tip-sample position while also allowing conventional AFM operation for imaging resulting structure. Using simple tip trajectories to bend the rod-shaped TMV, we observed a variety of resulting structures and mechanical failures. The distributed adhesive interaction between the virus and the sample surface, as well as the local tip-virus interaction affect the distortion in the shape of the virus. Experiments were performed in air as well as in liquid on graphite and Si substrates. The in-liquid experiments allow tuning of the environmental conditions, including osmolarity and pH, which are known to profoundly affect the virus structure. A continuum mechanical model relating mechanical properties to observations provides insight into the constraints for successful nondestructive manipulation.

  20. Cantilever clamp fitting

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B. (Inventor)

    1989-01-01

    A device is disclosed for sealing and clamping a cylindrical element which is to be attached to an object such as a wall, a pressurized vessel or another cylindrical element. The device includes a gland having an inner cylindrical wall, which is threaded at one end and is attached at a bendable end to a deformable portion, which in turn is attached to one end of a conical cantilever structure. The other end of the cantilever structure connects at a bendable area to one end of an outer cylindrical wall. The opposite end of cylindrical wall terminates in a thickened portion, the radially outer surface of which is adapted to accommodate a tool for rotating the gland. The terminal end of cylindrical wall also includes an abutment surface, which is adapted to engage a seal, which in turn engages a surface of a receiver. The receiver further includes a threaded portion for engagement with the threaded portion of gland whereby a tightening rotation of gland relative to receiver will cause relative movement between cylindrical walls and of gland. This movement causes a rotation of the conical structure and thus a bending action at bending area and at the bending end of the upper end of inner cylindrical wall. These rotational and bending actions result in a forcing of the deformable portion radially inwardly so as to contact and deform a pipe. This forcible contact creates a seal between gland and pipe, and simultaneously clamps the pipe in position.

  1. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Sader, John E.; Borgani, Riccardo; Gibson, Christopher T.; Haviland, David B.; Higgins, Michael J.; Kilpatrick, Jason I.; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J.; Slattery, Ashley D.; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-09-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others—standardising AFM force measurements—and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

  2. A virtual instrument to standardise the calibration of atomic force microscope cantilevers.

    PubMed

    Sader, John E; Borgani, Riccardo; Gibson, Christopher T; Haviland, David B; Higgins, Michael J; Kilpatrick, Jason I; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J; Slattery, Ashley D; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-09-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others-standardising AFM force measurements-and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

  3. Nanoscale structural features determined by AFM for single virus particles

    NASA Astrophysics Data System (ADS)

    Chen, Shu-Wen W.; Odorico, Michael; Meillan, Matthieu; Vellutini, Luc; Teulon, Jean-Marie; Parot, Pierre; Bennetau, Bernard; Pellequer, Jean-Luc

    2013-10-01

    In this work, we propose ``single-image analysis'', as opposed to multi-image averaging, for extracting valuable information from AFM images of single bio-particles. This approach allows us to study molecular systems imaged by AFM under general circumstances without restrictions on their structural forms. As feature exhibition is a resolution correlation, we have performed AFM imaging on surfaces of tobacco mosaic virus (TMV) to demonstrate variations of structural patterns with probing resolution. Two AFM images were acquired with the same tip at different probing resolutions in terms of pixel width, i.e., 1.95 and 0.49 nm per pixel. For assessment, we have constructed an in silico topograph based on the three-dimensional crystal structure of TMV as a reference. The prominent artifacts observed in the AFM-determined shape of TMV were attributed to tip convolutions. The width of TMV rod was systematically overestimated by ~10 nm at both probing resolutions of AFM. Nevertheless, the effects of tip convolution were less severe in vertical orientation so that the estimated height of TMV by AFM imaging was in close agreement with the in silico X-ray topograph. Using dedicated image processing algorithms, we found that at low resolution (i.e., 1.95 nm per pixel), the extracted surface features of TMV can be interpreted as a partial or full helical repeat (three complete turns with ~7.0 nm in length), while individual protein subunits (~2.5 nm) were perceivable only at high resolution. The present study shows that the scales of revealed structural features in AFM images are subject to both probing resolution and processing algorithms for image analysis.

  4. Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy

    NASA Astrophysics Data System (ADS)

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

    2016-10-01

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.

  5. Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

    SciTech Connect

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

    2016-09-08

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. In conclusion, GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.

  6. Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

    DOE PAGES

    Somnath, Suhas; Collins, Liam; Matheson, Michael A.; ...

    2016-09-08

    We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify themore » findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. In conclusion, GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.« less

  7. Note: Determination of torsional spring constant of atomic force microscopy cantilevers: combining normal spring constant and classical beam theory.

    PubMed

    Álvarez-Asencio, R; Thormann, E; Rutland, M W

    2013-09-01

    A technique has been developed for the calculation of torsional spring constants for AFM cantilevers based on the combination of the normal spring constant and plate/beam theory. It is easy to apply and allow the determination of torsional constants for stiff cantilevers where the thermal power spectrum is difficult to obtain due to the high resonance frequency and low signal/noise ratio. The applicability is shown to be general and this simple approach can thus be used to obtain torsional constants for any beam shaped cantilever.

  8. Absorption Spectroscopy and Imaging from the Visible through Mid-IR with 20 nm Resolution Using AFM probes

    NASA Astrophysics Data System (ADS)

    Centrone, Andrea

    2015-03-01

    Correlated nanoscale composition and optical property maps are important to engineer nanomaterials in applications ranging from photovoltaics to sensing and therapeutics. Wavelengths (λs) from the visible to near-IR probe electronic transitions in materials, providing information regarding band gap and defects while light in mid-IR probes vibrational transitions and provide chemical composition. However, light diffraction limits the lateral resolution of conventional micro-spectroscopic techniques to approximately λ/2, which is insufficient to image nanomaterials. Additionally, the λ-dependent resolution impedes direct comparison of spectral maps from different spectral ranges. Photo Thermal Induced Resonance (PTIR) is a novel technique that circumvents light diffraction by employing an AFM tip as a local detector for measuring light absorption with λ-independent nanoscale resolution. Our PTIR setup combines an AFM microscope with three lasers providing λ-tunability from 500 nm to 16000 nm continuously. The AFM tip transduces locally the sample thermal expansion induced by light absorption into large cantilever oscillations. Local absorption spectra (electronic or vibrational) and maps are obtained recording the amplitude of the tip deflection as a function of λ and position, respectively. The working principles of the PTIR technique will be described first, and nano-patterned polymer samples will be used to evaluate its lateral resolution, sensitivity and linearity. Results show that the PTIR signal intensity is proportional to the local absorbed energy suggesting applicability of this technique for quantitative chemical analysis at nanoscale, at least for thin (less than 1000 nm thick) samples. Additionally, a λ-independent resolution as high as 20 nm is demonstrated across the whole spectral range. In the second part of the talk, PTIR will be applied to image the dark plasmonic resonance of gold Asymmetric Split Ring Resonators (A-SRRs) in the mid

  9. Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback.

    PubMed

    Dede, M; Urkmen, K; Girişen, O; Atabak, M; Oral, A; Farrer, I; Ritchie, D

    2008-02-01

    Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of approximately 50 nm and 7 mG/Hz(1/2) at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; therefore the insulating substrates have to be coated with a thin layer of gold. This constraint can be eliminated with the AFM feedback using sophisticated Hall probes that are integrated with AFM cantilevers. However it is very difficult to micro fabricate these sensors. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The Hall sensor chip is simply glued at the end of a 32.768 kHz or 100 kHz Quartz crystal, which is used as force sensor. An LT-SHPM system is used to scan the samples. The sensor assembly is dithered at the resonance frequency using a digital Phase Locked Loop circuit and frequency shifts are used for AFM tracking. SHPM electronics is modified to detect AFM topography and the frequency shift, along with the magnetic field image. Magnetic domains and topography of an Iron Garnet thin film crystal, NdFeB demagnetised magnet and hard disk samples are presented at room temperature. The performance is found to be comparable with the SHPM using STM feedback.

  10. Bubble colloidal AFM probes formed from ultrasonically generated bubbles.

    PubMed

    Vakarelski, Ivan U; Lee, Judy; Dagastine, Raymond R; Chan, Derek Y C; Stevens, Geoffrey W; Grieser, Franz

    2008-02-05

    Here we introduce a simple and effective experimental approach to measuring the interaction forces between two small bubbles (approximately 80-140 microm) in aqueous solution during controlled collisions on the scale of micrometers to nanometers. The colloidal probe technique using atomic force microscopy (AFM) was extended to measure interaction forces between a cantilever-attached bubble and surface-attached bubbles of various sizes. By using an ultrasonic source, we generated numerous small bubbles on a mildly hydrophobic surface of a glass slide. A single bubble picked up with a strongly hydrophobized V-shaped cantilever was used as the colloidal probe. Sample force measurements were used to evaluate the pure water bubble cleanliness and the general consistency of the measurements.

  11. Cantilever epitaxial process

    DOEpatents

    Ashby, Carol I.; Follstaedt, David M.; Mitchell, Christine C.; Han, Jung

    2003-07-29

    A process of growing a material on a substrate, particularly growing a Group II-VI or Group III-V material, by a vapor-phase growth technique where the growth process eliminates the need for utilization of a mask or removal of the substrate from the reactor at any time during the processing. A nucleation layer is first grown upon which a middle layer is grown to provide surfaces for subsequent lateral cantilever growth. The lateral growth rate is controlled by altering the reactor temperature, pressure, reactant concentrations or reactant flow rates. Semiconductor materials, such as GaN, can be produced with dislocation densities less than 10.sup.7 /cm.sup.2.

  12. Probing the Double Layer: Effect of Image Forces on AFM

    PubMed Central

    Sachs, Frederick

    2006-01-01

    Force probes such as AFM tips or laser trap latex beads have a dielectric constant much less than that of the water that they displace. Thus when a probe approaches a charged surface under water it will be repelled simply based upon the image forces, and these can be of nN magnitude. PMID:16714346

  13. Chemical sensor with oscillating cantilevered probe

    DOEpatents

    Adams, Jesse D

    2013-02-05

    The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

  14. Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer.

    PubMed

    Inada, Natsumi; Asakawa, Hitoshi; Kobayashi, Taiki; Fukuma, Takeshi

    2016-01-01

    Photothermal excitation is a cantilever excitation method that enables stable and accurate operation for dynamic-mode AFM measurements. However, the low excitation efficiency of the method has often limited its application in practical studies. In this study, we propose a method for improving the photothermal excitation efficiency by coating cantilever backside surface near its fixed end with colloidal graphite as a photothermal conversion (PTC) layer. The excitation efficiency for a standard cantilever of PPP-NCHAuD with a spring constant of ≈40 N/m and a relatively stiff cantilever of AC55 with a spring constant of ≈140 N/m were improved by 6.1 times and 2.5 times, respectively, by coating with a PTC layer. We experimentally demonstrate high stability of the PTC layer in liquid by AFM imaging of a mica surface with atomic resolution in phosphate buffer saline solution for more than 2 h without any indication of possible contamination from the coating. The proposed method, using a PTC layer made of colloidal graphite, greatly enhances photothermal excitation efficiency even for a relatively stiff cantilever in liquid.

  15. Dispersion and Fixation of Adeno-Associated Virus with Glutaraldehyde for Afm Studies

    NASA Astrophysics Data System (ADS)

    Wang, Peng; Wang, Xinyan; Yang, Haijun; Lü, Junhong

    Sample preparation is an important procedure for atomic force microscope (AFM) studies. However, flexible virus particles have a tendency to aggregate together and are easily compressed during sample preparation or by AFM tip that subsequently hamper studying of virus by AFM. Herein, low concentration chemical reagent of glutaraldehyde (2%, v/v) is pre-mixed in virus suspension that facilitates the dispersion and observation of recombinant serotype 2 adeno-associated virus particles deposited on mica surface with little deformation.

  16. High throughput reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-01-21

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  17. High throughout reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-11-25

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  18. Batch-fabrication of cantilevered magnets on attonewton-sensitivity mechanical oscillators for scanned-probe nanoscale magnetic resonance imaging.

    PubMed

    Hickman, Steven A; Moore, Eric W; Lee, SangGap; Longenecker, Jonilyn G; Wright, Sarah J; Harrell, Lee E; Marohn, John A

    2010-12-28

    We have batch-fabricated cantilevers with ∼100 nm diameter nickel nanorod tips and force sensitivities of a few attonewtons at 4.2 K. The magnetic nanorods were engineered to overhang the leading edge of the cantilever, and consequently the cantilevers experience what we believe is the lowest surface noise ever achieved in a scanned probe experiment. Cantilever magnetometry indicated that the tips were well magnetized, with a ≤ 20 nm dead layer; the composition of the dead layer was studied by electron microscopy and electron energy loss spectroscopy. In what we believe is the first demonstration of scanned probe detection of electron-spin resonance from a batch-fabricated tip, the cantilevers were used to observe electron-spin resonance from nitroxide spin labels in a film via force-gradient-induced shifts in cantilever resonance frequency. The magnetic field dependence of the magnetic resonance signal suggests a nonuniform tip magnetization at an applied field near 0.6 T.

  19. Fabrication of microelectromechanical systems (MEMS) cantilevers for photoacoustic (PA) detection of terahertz (THz) radiation

    NASA Astrophysics Data System (ADS)

    Newberry, R.; Glauvitz, N.; Coutu, R. A.; Medvedev, I. R.; Petkie, D.

    2014-03-01

    Historically, spectroscopy has been a cumbersome endeavor due to the relatively large sizes (3ft - 100ft in length) of modern spectroscopy systems. Taking advantage of the photoacoustic effect would allow for much smaller absorption chambers since the photoacoustic (PA) effect is independent of the absorption path length. In order to detect the photoacoustic waves being generated, a photoacoustic microphone would be required. This paper reports on the fabrication efforts taken in order to create microelectromechanical systems (MEMS) cantilevers for the purpose of sensing photoacoustic waves generated via terahertz (THz) radiation passing through a gaseous sample. The cantilevers are first modeled through the use of the finite element modeling software, CoventorWare®. The cantilevers fabricated with bulk micromachining processes and are 7x2x0.010mm on a silicon-on-insulator (SOI) wafer which acts as the physical structure of the cantilever. The devices are released by etching through the wafer's backside and etching through the buried oxide with hydrofluoric acid. The cantilevers are placed in a test chamber and their vibration and deflection are measured via a Michelson type interferometer that reflects a laser off a gold tip evaporated onto the tip of the cantilever. The test chamber is machined from stainless steel and housed in a THz testing environment at Wright State University. Fabricated devices have decreased residual stress and larger radii of curvatures by approximately 10X.

  20. Assessment of insulated conductive cantilevers for biology and electrochemistry

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Gullo, Maurizio R.; Akiyama, Terunobu; Tonin, Andreas; de Rooij, Nicolaas F.; Staufer, Urs; Engel, Andreas

    2005-08-01

    This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <=0.1 N m-1 and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than 1 pA in faradaic current with a lateral resolution of 7.8 nm.

  1. PREFACE: NC-AFM 2006: Proceedings of the 9th International Conference on Non-contact Atomic Force Microscopy

    NASA Astrophysics Data System (ADS)

    Tomitori, Masahiko; Onishi, Hiroshi

    2007-02-01

    The advent of scanning probe microscopy (SPM) in the 1980s has significantly promoted nanoscience and nanotechnology. In particular, non-contact atomic force microscopy (NC-AFM), one of the SPM family, has unique capabilities with high spatial resolution for nanoscale measurements in vacuum, air and liquids. In the last decade we have witnessed the rapid progress of NC-AFM with improved performance and increasing applications. A series of NC-AFM international conferences have greatly contributed to this field. Initiated in Osaka in 1998, the NC-AFM meeting has been followed by annual conferences at Pontresina, Hamburg, Kyoto, Montreal, Dingle, Seattle and Bad Essen. The 9th conference was held in Kobe, Japan, 16-20 July 2006. This special issue of Nanotechnology contains the outstanding contributions of the conference. During the meeting delegates learnt about a number of significant advances. Topics covered atomic resolution imaging of metals, semiconductors, insulators, ionic crystals, oxides, molecular systems, imaging of biological materials in various environments and novel instrumentation. Work also included the characterization of electronic and magnetic properties, tip and cantilever fabrication and characterization, atomic distinction based on analysis of tip-sample interaction, atomic scale manipulation, fabrication of nanostructures using NC-AFM, and related theories and simulations. We are greatly impressed by the increasing number of applications, and convinced that NC-AFM and related techniques are building a bridge to a future nano world, where quantum phenomena will dominate and nano devices will be realized. In addition, a special session on SPM road maps was held as a first trial in the field, where the future prospects of SPM were discussed enthusiastically. The overall success of the NC-AFM 2006 conference was due to the efforts of many individuals and groups with respect to scientific and technological progress, as well as the international

  2. Nondestructive testing and hardness measurement based on contact resonance of piezoelectric cantilevers (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Li, Faxin; Fu, Ji

    2016-04-01

    A suitable defect identification parameter is very important in the field of nondestructive testing (NDT). In this work, we proposed a NDT method which detects the sample's local contact stiffness (LCS) based on the contact resonance of a piezoelectric cantilever. Firstly, through finite element analysis we showed that LCS is quite sensitive to typical defects including debonding, voids, cracks and inclusions, making it a good identification parameter. Secondly, a homemade NDT system containing a piezoelectric unimorph cantilever was assembled to detect the sample's LCS by tracking the contact resonance frequency (CRF) of the cantilever-sample system based on strain signals. Testing results indicated that this NDT system could detect the above mentioned defects efficiently. The cantilever-stiffness dependent detection sensitivity was specially investigated and the stiffer cantilevers were found to be more sensitive to small defects. Then, a piezoelectric bimorph cantilever was fabricated and the electromechanical impedance, other than the strain signals, was measured to track the CRF of the cantilever-system. The LCS is then derived by using the equivalent-circuit model. The electromechanical impedance based NDT system is more compact and can be further developed to be a portable device. Finally, a Vicker indenter is fabricated onto the bimorph tip and the contact area is derived from the measured LCS. Thus the NDT system turns to be a hardness tester without any optical devices. It is very useful for in-situ testing or testing on inner surfaces where conventional hardness tester is not applicable.

  3. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers.

    PubMed

    Golovko, Dmytro S; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar

    2007-04-01

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the end of cantilevers, we load them with water microdrops generated by a commercial inkjet dispenser. Such a device is capable of generating drops, and thus masses, of extremely reproducible size. This makes it an ideal tool for calibration tasks. Moreover, the major advantage of water microdrops is that they allow for a nearly contactless calibration: no mechanical micromanipulation of particles on cantilevers is required, neither for their deposition nor for removal. After some seconds the water drop is completely evaporated, and no residues are left on the cantilever surface or tip. We present two variants: we vary the size of the drops and deposit them at the free end of the cantilever, or we keep the size of the drops constant and vary their position along the cantilever. For the second variant, we implemented also numerical simulations. Spring constants measured by this method are comparable to results obtained by the thermal noise method, as we demonstrate for six different cantilevers.

  4. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers

    SciTech Connect

    Golovko, Dmytro S.; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar

    2007-04-15

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the end of cantilevers, we load them with water microdrops generated by a commercial inkjet dispenser. Such a device is capable of generating drops, and thus masses, of extremely reproducible size. This makes it an ideal tool for calibration tasks. Moreover, the major advantage of water microdrops is that they allow for a nearly contactless calibration: no mechanical micromanipulation of particles on cantilevers is required, neither for their deposition nor for removal. After some seconds the water drop is completely evaporated, and no residues are left on the cantilever surface or tip. We present two variants: we vary the size of the drops and deposit them at the free end of the cantilever, or we keep the size of the drops constant and vary their position along the cantilever. For the second variant, we implemented also numerical simulations. Spring constants measured by this method are comparable to results obtained by the thermal noise method, as we demonstrate for six different cantilevers.

  5. Characterizing Cell Mechanics with AFM and Microfluidics

    NASA Astrophysics Data System (ADS)

    Walter, N.; Micoulet, A.; Suresh, S.; Spatz, J. P.

    2007-03-01

    Cell mechanical properties and functionality are mainly determined by the cytoskeleton, besides the cell membrane, the nucleus and the cytosol, and depend on various parameters e.g. surface chemistry and rigidity, surface area and time available for cell spreading, nutrients and drugs provided in the culture medium. Human epithelial pancreatic and mammary cancer cells and their keratin intermediate filaments are the main focus of our work. We use Atomic Force Microscopy (AFM) to study cells adhering to substrates and Microfluidic Channels to probe cells in suspension, respectively. Local and global properties are extracted by varying AFM probe tip size and the available adhesion area for cells. Depth-sensing, instrumented indentation tests with AFM show a clear difference in contact stiffness for cells that are spread of controlled substrates and those that are loosely attached. Microfluidic Channels are utilized in parallel to evaluate cell deformation and ``flow resistance'', which are dependent on channel cross section, flow rate, cell nucleus size and the mechanical properties of cytoskeleton and membrane. The results from the study are used to provide some broad and quantitative assessments of the connections between cellular/subcellular mechanics and biochemical origins of disease states.

  6. Nanomechanics of Yeast Surfaces Revealed by AFM

    NASA Astrophysics Data System (ADS)

    Dague, Etienne; Beaussart, Audrey; Alsteens, David

    Despite the large and well-documented characterization of the microbial cell wall in terms of chemical composition, the determination of the mechanical properties of surface molecules in relation to their function remains a key challenge in cell biology.The emergence of powerful tools allowing molecular manipulations has already revolutionized our understanding of the surface properties of fungal cells. At the frontier between nanophysics and molecular biology, atomic force microscopy (AFM), and more specifically single-molecule force spectroscopy (SMFS), has strongly contributed to our current knowledge of the cell wall organization and nanomechanical properties. However, due to the complexity of the technique, measurements on live cells are still at their infancy.In this chapter, we describe the cell wall composition and recapitulate the principles of AFM as well as the main current methodologies used to perform AFM measurements on live cells, including sample immobilization and tip functionalization.The current status of the progress in probing nanomechanics of the yeast surface is illustrated through three recent breakthrough studies. Determination of the cell wall nanostructure and elasticity is presented through two examples: the mechanical response of mannoproteins from brewing yeasts and elasticity measurements on lacking polysaccharide mutant strains. Additionally, an elegant study on force-induced unfolding and clustering of adhesion proteins located at the cell surface is also presented.

  7. CO tip functionalization in subatomic resolution atomic force microscopy

    SciTech Connect

    Kim, Minjung; Chelikowsky, James R.

    2015-10-19

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule.

  8. Microdrops on atomic force microscope cantilevers: evaporation of water and spring constant calibration.

    PubMed

    Bonaccurso, Elmar; Butt, Hans-Jürgen

    2005-01-13

    The evaporation of water drops with radii approximately 20 microm was investigated experimentally by depositing them onto atomic force microscope (AFM) cantilevers and measuring the deflection versus time. Because of the surface tension of the liquid, the Laplace pressure inside the drop, and the change of interfacial stress at the solid-liquid interface, the cantilever is deflected by typically a few hundred nanometers. The experimental results are in accordance with an analytic theory developed. The evaporation process could be monitored with high accuracy even at the last stage of evaporation because (1) cantilever deflections can be measured with nanometer resolution and (2) the time resolution, given by the inverse of the resonance frequency of the cantilever of approximately 0.3 ms, is much faster than the typical evaporation time of 1 s. Experimental results indicate that evaporation of the last thin layer of water is significantly slower than the rest of the drop, which can be due to surface forces. This drop-on-cantilever system can also be used to analyze the drop impact dynamics on a surface and to determine the spring constant of cantilevers.

  9. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    PubMed Central

    Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    Summary We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  10. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans.

    PubMed

    Meier, Tobias; Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm(3) is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.

  11. Evaluation of critical interlaminar SIF of DCB specimen made of slender cantilever

    NASA Astrophysics Data System (ADS)

    Verma, S. K.; Kumar, Prashant; Kishore, N. N.; Potty, P. K. Kesavan

    1995-02-01

    A method has been developed involving combined numerical and experimental techniques to evaluate interlaminar fracture toughness (K(sub 1c)) of the double cantilever beam specimen with slender cantilevers. Using FEM, a relationship is developed between the critical stress intensity factor and strain at a point near the crack tip. The strain is measured through a strain gauge of 0.2 mm gauge length. The location and the orientation for the strain gauge are optimized by the numerical analysis. Experiments were conducted on a DCB specimen prepared by bonding two thin plates of a hardened steel alloy. K(sub 1c) of the interlaminar crack was determined by (1) the combined numencal and experimental technique knowing the strain near the crack tip; and (2) the numerical method knowing the loads at the cantilever ends. The experimental results were found to be within 18 percent of the predicted values.

  12. Multidomain piezo-ceramic cantilever

    NASA Astrophysics Data System (ADS)

    Sedorook, David P.

    PZT-5H is a ferroelectric and piezoelectric material that has many applications that are the subjects of current research. As a ferroelectric, PZT-5H has a permanent electrical polarization that arises from ferroelectric domains. In this thesis, numerical simulations were conducted via the well know Finite Element Method of several types of piezoelectric cantilevers that were made of PIC-181, a high quality PZT-5H made in Germany. Single crystal cantilever models with multiple polarization vectors were investigated with Q factors ranging from Q = 50 to Q = 1200, where the acoustical displacements were calculated. Further, the displacements were calculated for a multidomain cantilever model with inversely poled domains and uniform electrode configuration as well as a single crystal cantilever model with uniformly poled crystal and bipolar electrode configuration. It was shown that cantilevers that are less oblong in shape could benefit from the bipolar electrode configuration in applications where size may be an important parameter, for instance in small flying robotic insects. From the experimental measurements of the resonance and anti-resonance frequencies in various PIC-181 samples, the radial and longitudinal components of speed of sound in material were calculated. Experimental results of longitudinal speed of sound differed from the accepted value of 4.6 km/s by 1.6 % error.

  13. The importance of correcting for variable probe-sample interactions in AFM-IR spectroscopy: AFM-IR of dried bacteria on a polyurethane film.

    PubMed

    Barlow, Daniel E; Biffinger, Justin C; Cockrell-Zugell, Allison L; Lo, Michael; Kjoller, Kevin; Cook, Debra; Lee, Woo Kyung; Pehrsson, Pehr E; Crookes-Goodson, Wendy J; Hung, Chia-Suei; Nadeau, Lloyd J; Russell, John N

    2016-08-02

    AFM-IR is a combined atomic force microscopy-infrared spectroscopy method that shows promise for nanoscale chemical characterization of biological-materials interactions. In an effort to apply this method to quantitatively probe mechanisms of microbiologically induced polyurethane degradation, we have investigated monolayer clusters of ∼200 nm thick Pseudomonas protegens Pf-5 bacteria (Pf) on a 300 nm thick polyether-polyurethane (PU) film. Here, the impact of the different biological and polymer mechanical properties on the thermomechanical AFM-IR detection mechanism was first assessed without the additional complication of polymer degradation. AFM-IR spectra of Pf and PU were compared with FTIR and showed good agreement. Local AFM-IR spectra of Pf on PU (Pf-PU) exhibited bands from both constituents, showing that AFM-IR is sensitive to chemical composition both at and below the surface. One distinct difference in local AFM-IR spectra on Pf-PU was an anomalous ∼4× increase in IR peak intensities for the probe in contact with Pf versus PU. This was attributed to differences in probe-sample interactions. In particular, significantly higher cantilever damping was observed for probe contact with PU, with a ∼10× smaller Q factor. AFM-IR chemical mapping at single wavelengths was also affected. We demonstrate ratioing of mapping data for chemical analysis as a simple method to cancel the extreme effects of the variable probe-sample interactions.

  14. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-01

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17fm/√Hz by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  15. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    SciTech Connect

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-15

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm/{radical}(Hz) by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  16. Influence of Fluid Cell Design on the Frequency Response of AFM Microcantilevers in Liquid Media

    PubMed Central

    Motamedi, Ramin; Wood-Adams, Paula M.

    2008-01-01

    A study of the frequency response of AFM microcantilevers in liquid media contained in a commercial fluid cell is presented. Such systems exhibit complicated dynamics which are often not well described by available theories. Their dynamic behavior has a direct effect on the use of the AFM in dynamic mode while imaging in liquid or while extracting the rheological properties of the fluid. We explore the issues related to the design of the cantilever holder/fluid cell and propose an approach for evaluating, minimizing and recognizing the ultimate limitations of commercial cantilever holders. A technique for estimating the frequency response spectrum of the fluid cell itself from experimental data is presented. This spectrum can then be used to evaluate whether or not the fluid cell is suited for the desired purpose. PMID:27873849

  17. Solvent-mediated repair and patterning of surfaces by AFM

    SciTech Connect

    Elhadj, S; Chernov, A; De Yoreo, J

    2007-10-30

    A tip-based approach to shaping surfaces of soluble materials with nanometer-scale control is reported. The proposed method can be used, for example, to eliminate defects and inhomogeneities in surface shape, repair mechanical or laser-induced damage to surfaces, or perform 3D lithography on the length scale of an AFM tip. The phenomenon that enables smoothing and repair of surfaces is based on the transport of material from regions of high- to low-curvature within the solution meniscus formed in a solvent-containing atmosphere between the surface in question and an AFM tip scanned over the surface. Using in situ AFM measurements of the kinetics of surface remodeling on KDP (KH{sub 2}PO{sub 4}) crystals in humid air, we show that redistribution of solute material during relaxation of grooves and mounds is driven by a reduction in surface free energy as described by the Gibbs-Thomson law. We find that the perturbation from a flat interface evolves according to the diffusion equation where the effective diffusivity is determined by the product of the surface stiffness and the step kinetic coefficient. We also show that, surprisingly, if the tip is instead scanned over or kept stationary above an atomically flat area of the surface, a convex structure is formed with a diameter that is controlled by the dimensions of the meniscus, indicating that the presence of the tip and meniscus reduces the substrate chemical potential beneath that of the free surface. This allows one to create nanometer-scale 3D structures of arbitrary shape without the removal of substrate material or the use of extrinsic masks or chemical compounds. Potential applications of these tip-based phenomena are discussed.

  18. Sub-diffraction nano manipulation using STED AFM.

    PubMed

    Chacko, Jenu Varghese; Canale, Claudio; Harke, Benjamin; Diaspro, Alberto

    2013-01-01

    In the last two decades, nano manipulation has been recognized as a potential tool of scientific interest especially in nanotechnology and nano-robotics. Contemporary optical microscopy (super resolution) techniques have also reached the nanometer scale resolution to visualize this and hence a combination of super resolution aided nano manipulation ineluctably gives a new perspective to the scenario. Here we demonstrate how specificity and rapid determination of structures provided by stimulated emission depletion (STED) microscope can aid another microscopic tool with capability of mechanical manoeuvring, like an atomic force microscope (AFM) to get topological information or to target nano scaled materials. We also give proof of principle on how high-resolution real time visualization can improve nano manipulation capability within a dense sample, and how STED-AFM is an optimal combination for this job. With these evidences, this article points to future precise nano dissections and maybe even to a nano-snooker game with an AFM tip and fluorospheres.

  19. Cantilevered probe detector with piezoelectric element

    SciTech Connect

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  20. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  1. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  2. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D [Reno, NV; Sulchek, Todd A [Oakland, CA; Feigin, Stuart C [Reno, NV

    2012-07-10

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  3. Note: Aligned deposition and modal characterization of micron and submicron poly(methyl methacyrlate) fiber cantilevers.

    PubMed

    Nain, Amrinder S; Filiz, Sinan; Ozdoganlar, O Burak; Sitti, Metin; Amon, Cristina

    2010-01-01

    Polymeric micro-/nanofibers are finding increasing use as sensors for novel applications. Here, we demonstrate the ability to deposit an array of poly(methyl methacyrlate) fibers with micron and submicron diameters in aligned configurations on customized piezoelectric shakers. Using lateral motion of an atomic force microscope tip, fibers are broken to obtain fiber cantilevers of high aspect ratio (length/diameter > 20). The resonant frequencies of fabricated microfiber cantilevers are experimentally measured using a laser Doppler vibrometer. An average Young's modulus of 3.5 GPa and quality factor of 20 were estimated from the experimentally obtained frequency responses.

  4. Effect of AFM probe geometry on visco-hyperelastic characterization of soft materials

    NASA Astrophysics Data System (ADS)

    Boccaccio, Antonio; Lamberti, Luciano; Papi, Massimiliano; De Spirito, Marco; Pappalettere, Carmine

    2015-08-01

    Atomic force microscopy (AFM) nanoindentation is very suited for nano- and microscale mechanical characterization of soft materials. Although the structural response of polymeric networks that form soft matter depends on viscous effects caused by the relative slippage of polymeric chains, the usual assumption made in the AFM-based characterization is that the specimen behaves as a purely elastic material and viscous forces are negligible. However, for each geometric configuration of the AFM tip, there will be a limit indentation rate above which viscous effects must be taken into account to correctly determine mechanical properties. A parametric finite element study conducted on 12 geometric configurations of a blunt cone AFM tip (overall, the study included about 200 finite element analyses) allowed us to determine the limit indentation rate for each configuration. The selected tip dimensions cover commercially available products and account for changes in tip geometry caused by serial measurements. Nanoindentation rates cover typical experimental conditions set in AFM bio-measurements on soft matter. Viscous effects appear to be more significant in the case of sharper tips. This implies that, if quantitative data on sample viscosity are not available, using a rounded indenter and carrying out experiments below the limit indentation rate will allow errors in the determination of mechanical properties to be minimized.

  5. Tunnel junctions, cantilevers, and potentials

    NASA Astrophysics Data System (ADS)

    Tanner, Shawn

    We have developed a process for making sub-micrometer dimensional cantilevers, clamped beams, and more complicate electro-mechanical structures that carry integrated electrical leads. Such objects are perhaps useful as test structures for connecting to and measuring the electrical properties of molecular sized objects, as high frequency electromechanical components for radio and microwave frequency applications, and as sensor components for studying the fluctuation physics of small machines. Our process uses two realigned electron-beam lithography steps, a thin film angled deposition system, and differential removal of sacrificial aluminum layers to produce freely suspended sub-micron electromechanical components. We have produced cantilevers and beams on a variety of substrates (silica, silicon, and poly-imide) and have produced insulating, conductive, and multi-layer mechanical structures. We have measured mechanical resonances in the 10 MHz range by electrostatically actuating the cantilevers while in a magnetic field (3500 gauss) and measuring the voltage that results across the front edge of the cantilever. Two structures are fabricated sharing a common ground so that a balanced detection technique can be used to eliminate background signals. Due to the square dependence of the electrostatic force on the voltage, they can be resonated by a drive voltage of 1/2 the natural frequency or at the natural frequency. Two separate attempts have been made to apply these resonators. First, a process was developed to integrate a tunnel junction with the cantilever. These devices can possibly be used for probing small-scale systems such as molecules. We have verified the exponential variation of the tunneling resistance with both substrate flex and electrostatic gating. Second, a novel gate structure was developed to create a double potential well for resonator motion. This is accomplished by placing a multilayer structure in front of the hairpin cantilever consisting two

  6. The stress intensity factor for the double cantilever beam

    NASA Technical Reports Server (NTRS)

    Fichter, W. B.

    1983-01-01

    Fourier transforms and the Wiener-Hopf technique are used in conjunction with plane elastostatics to examine the singular crack tip stress field in the double cantilever beam (DCB) specimen. In place of the Dirac delta function, a family of functions which duplicates the important features of the concentrated forces without introducing unmanageable mathematical complexities is used as a loading function. With terms of order h-squared/a-squared retained in the series expansion, the dimensionless stress intensity factor is found to be K (h to the 1/2)/P = 12 to the 1/2 (a/h + 0.6728 + 0.0377 h-squared/a-squared), in which P is the magnitude of the concentrated forces per unit thickness, a is the distance from the crack tip to the points of load application, and h is the height of each cantilever beam. The result is similar to that obtained by Gross and Srawley by fitting a line to discrete results from their boundary collocation analysis.

  7. Massively Multiplexed Cantilever-free Scanning Probe Lithography

    NASA Astrophysics Data System (ADS)

    Brown, Keith A.; Eichelsdoerfer, Daniel J.; Shim, Wooyoung; Boya, Radha; Schmucker, Abrin L.; Liu, Guoliang; Mirkin, Chad A.

    2013-03-01

    Cantilever-free scanning probe lithography has emerged as a low-cost technique for rapidly patterning nanoscale materials. In this architecture, an array of probes is fabricated on a soft backing layer that provides mechanical compliance to each probe while an underlying hard surface maintains the structural integrity of the array. One drawback of this technique is that each probe in the array acts simultaneously and thus generates a copy of the same pattern. Here, we discuss recent efforts to incorporate heaters into these probe arrays so that when a given heater is activated, the thermal expansion of the elastomer actuates a single tip. We find thermal actuation to be powerful enough to actuate individual tips over 4 μm with minimal crosstalk, fast enough to actuate on relevant time scales (20 ms), and scalable by virtue of being electrically addressable. Furthermore, tuning the individual heaters allows for variability in the arrays to be compensated for precisely, resulting in high quality nanopatterning. The addition of tunable actuators transforms cantilever-free scanning probe lithography into a technique capable of true desktop nanofabrication.

  8. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-02

    contact angle. All but one of the eight measurements agreed to within 13%. The constant diameter of the nanoneedle also is used to relate viscous damping of the vibrating cantilever to a macroscopic model of Stokes drag on a long cylinder. Expected increases in drag force with insertion depth and viscosity are observed for several glycerol-water solutions. However, an additional damping term (associated with drag of the meniscus on the sidewalls of the nanoneedle) limits the sensitivity of the measurement of drag force for low-viscosity solutions, while low values of Q limit the sensitivity for high-viscosity solutions. Overall, reasonable correspondence is found between the macroscopic models and the measurements with the nanoneedle-tipped probes. Tighter environmental control of the AFM and treatments of needles to give them more ideal surfaces are expected to improve repeatability and make more evident subtle features that currently appear to be present on the F-D and Q damping curves.

  9. Sharp Tips on the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

    The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  10. Fabrication of high-density cantilever arrays and through-wafer interconnects

    SciTech Connect

    A. Harley, J.; Abdollahi-Alibeik, S.; Chow, E. M.; Kenney, T. W.; McCarthy, A. M.; McVittie, J. P.; Partridge; Quate, C. F.; Soh, H. T.

    1998-11-03

    Processes to fabricate dense, dry released microstructures with electrical connections on the opposite side of the wafer are described. A 10 x 10 array of silicon and polysilicon cantilevers with high packing density (5 tips/mm2) and high uniformity (<10 µm length variation across the wafer) are demonstrated. The cantilever release process uses a deep SF6/C4F8, plasma etch followed by a HBr plasma etch to accurately release cantilevers. A process for fabricating electrical contacts through the backside of the wafer is also described. Electrodeposited resist, conformal CVD metal deposition and deep SF6/C4F8 plasma etching are used to make 30 µm/side square vias each of which has a resistance of 50 m(omega).

  11. Measurement of polyamide and polystyrene adhesion with coated-tip atomic force microscopy.

    PubMed

    Thio, Beng Joo Reginald; Meredith, J Carson

    2007-10-01

    This work presents atomic force microscopy (AFM) measurements of adhesion forces between polyamides, polystyrene and AFM tips coated with the same materials. The polymers employed were polyamide 6 (PA6), PA66, PA12 and polystyrene (PS). All adhesion forces between the various unmodified or modified AFM tips and the polymer surfaces were in the range -1.5 to -8 nN. The weakest force was observed for an unmodified AFM tip with a PS surface and the strongest was between a PS-coated tip and PS surface. The results point to both the benefits and drawbacks of coated-tip AFM force-distance measurements. Adhesion forces between the two most dissimilar (PA6-PS and PA66-PS) materials were significantly asymmetric, e.g., the forces were different depending on the relative placement of each polymer on the AFM tip or substrate. Materials with similar chemistry and intermolecular interactions yielded forces in close agreement regardless of placement on tip or substrate. Using experimental forces, we calculated the contact radii via four models: Derjaguin, Muller, and Toporov; Johnson, Kendall, and Roberts; parametric tip-force-distance relation; and a square pyramid-flat surface (SPFS) model developed herein. The SPFS model gave the most reasonable contact tip radius estimate. Hamaker constants calculated from the SPFS model using this radius agreed in both magnitude and trends with experiment and Lifshitz theory.

  12. Near-Field Acoustical Imaging using Lateral Bending Mode of Atomic Force Microscope Cantilevers

    NASA Astrophysics Data System (ADS)

    Caron, A.; Rabe, U.; Rödel, J.; Arnold, W.

    Scanning probe microscopy techniques enable one to investigate surface properties such as contact stiffness and friction between the probe tip and a sample with nm resolution. So far the bending and the torsional eigenmodes of an atomic force microscope cantilever have been used to image variations of elasticity and shear elasticity, respectively. Such images are near-field images with the resolution given by the contact radius typically between 10 nm and 50 nm. We show that the flexural modes of a cantilever oscillating in the width direction and parallel to the sample surface can also be used for imaging. Additional to the dominant in-plane component of the oscillation, the lateral modes exhibit a vertical component as well, provided there is an asymmetry in the cross-section of the cantilever or in its suspension. The out-of-plane deflection renders the lateral modes detectable by the optical position sensors used in atomic force microscopes. We studied cracks which were generated by Vickers indents, in submicro- and nanocrystalline ZrO2. Images of the lateral contact stiffness were obtained by vibrating the cantilever close to a contact-resonance frequency. A change in contact stiffness causes a shift of the resonant frequency and hence a change of the cantilever vibration amplitude. The lateral contact-stiffness images close to the crack faces display a contrast that we attribute to altered elastic properties indicating a process zone. This could be caused by a stress-induced phase transformation during crack propagation. Using the contact mode of an atomic force microscope, we measured the crack-opening displacement as a function of distance from the crack tip, and we determined the crack-tip toughness Ktip. Furthermore, K1c was inferred from the length of radial cracks of Vickers indents that were measured using classical scanning acoustic microscopy

  13. Position and mode dependent optical detection back-action in cantilever beam resonators

    NASA Astrophysics Data System (ADS)

    Larsen, T.; Schmid, S.; Dohn, S.; Sader, J. E.; Boisen, A.; Villanueva, L. G.

    2017-03-01

    Optical detection back-action in cantilever resonant or static detection presents a challenge when striving for state-of-the-art performance. The origin and possible routes for minimizing optical back-action have received little attention in literature. Here, we investigate the position and mode dependent optical back-action on cantilever beam resonators. A high power heating laser (100 µW) is scanned across a silicon nitride cantilever while its effect on the first three resonance modes is detected via a low-power readout laser (1 µW) positioned at the cantilever tip. We find that the measured effect of back-action is not only dependent on position but also the shape of the resonance mode. Relevant silicon nitride material parameters are extracted by fitting finite element (FE) simulations to the temperature-dependent frequency response of the first three modes. In a second round of simulations, using the extracted parameters, we successfully fit the FEM results with the measured mode and position dependent back-action. From the simulations, we can conclude that the observed frequency tuning is due to temperature induced changes in stress. Effects of changes in material properties and dimensions are negligible. Finally, different routes for minimizing the effect of this optical detection back-action are described, allowing further improvements of cantilever-based sensing in general.

  14. Near-Field Spectroscopy with Nanoparticles Deposited by AFM

    NASA Technical Reports Server (NTRS)

    Anderson, Mark S.

    2008-01-01

    An alternative approach to apertureless near-field optical spectroscopy involving an atomic-force microscope (AFM) entails less complexity of equipment than does a prior approach. The alternative approach has been demonstrated to be applicable to apertureless near-field optical spectroscopy of the type using an AFM and surface enhanced Raman scattering (SERS), and is expected to be equally applicable in cases in which infrared or fluorescence spectroscopy is used. Apertureless near-field optical spectroscopy is a means of performing spatially resolved analyses of chemical compositions of surface regions of nanostructured materials. In apertureless near-field spectroscopy, it is common practice to utilize nanostructured probe tips or nanoparticles (usually of gold) having shapes and dimensions chosen to exploit plasmon resonances so as to increase spectroscopic-signal strengths. To implement the particular prior approach to which the present approach is an alternative, it is necessary to integrate a Raman spectrometer with an AFM and to utilize a special SERS-active probe tip. The resulting instrumentation system is complex, and the tasks of designing and constructing the system and using the system to acquire spectro-chemical information from nanometer-scale regions on a surface are correspondingly demanding.

  15. Cantilevers orthodontics forces measured by fiber sensors

    NASA Astrophysics Data System (ADS)

    Schneider, Neblyssa; Milczewski, Maura S.; de Oliveira, Valmir; Guariza Filho, Odilon; Lopes, Stephani C. P. S.; Kalinowski, Hypolito J.

    2015-09-01

    Fibers Bragg Gratings were used to evaluate the transmission of the forces generates by orthodontic mechanic based one and two cantilevers used to move molars to the upright position. The results showed levels forces of approximately 0,14N near to the root of the molar with one and two cantilevers.

  16. Magnetoelectric versus thermal actuation characteristics of shear force AFM probes with piezoresistive detection

    NASA Astrophysics Data System (ADS)

    Sierakowski, Andrzej; Kopiec, Daniel; Majstrzyk, Wojciech; Kunicki, Piotr; Janus, Paweł; Dobrowolski, Rafał; Grabiec, Piotr; Rangelow, Ivo W.; Gotszalk, Teodor

    2017-03-01

    In this paper the authors compare methods used for piezoresistive microcantilevers actuation for the atomic force microscopy (AFM) imaging in the dynamic shear force mode. The piezoresistive detection is an attractive technique comparing the optical beam detection of deflection. The principal advantage is that no external alignment of optical source and detector are needed. When the microcantilever is deflected, the stress is transferred into a change of resistivity of piezoresistors. The integration of piezoresistive read-out provides a promising solution in realizing a compact non-contact AFM. Resolution of piezoresistive read-out is limited by three main noise sources: Johnson, 1/f and thermomechanical noise. In the dynamic shear force mode measurement the method used for cantilever actuation will also affect the recorded noise in the piezoresistive detection circuit. This is the result of a crosstalk between an aluminium path (current loop used for actuation) and piezoresistors located near the base of the beam. In this paper authors described an elaborated in ITE (Institute of Electron Technology) technology of fabrication cantilevers with piezoresistive detection of deflection and compared efficiency of two methods used for cantilever actuation.

  17. Feedback Control of Vibrations in a Micromachined Cantilever Beam with Electrostatic Actuators

    NASA Astrophysics Data System (ADS)

    Wang, P. K. C.

    1998-06-01

    The problem of feedback control of vibrations in a micromachined cantilever beam with nonlinear electrostatic actuators is considered. Various forms of nonlinear feedback controls depending on localized spatial averages of the beam velocity and displacement near the beam tip are derived by considering the time rate-of-change of the total energy of the beam. The physical implementation of the derived feedback controls is discussed briefly. The dynamic behaviour of the beam with the derived feedback controls is determined by computer simulation.

  18. Oscillations of end loaded cantilever beams

    NASA Astrophysics Data System (ADS)

    Macho-Stadler, E.; Elejalde-García, M. J.; Llanos-Vázquez, R.

    2015-09-01

    This article presents several simple experiments based on changing transverse vibration frequencies in a cantilever beam, when acted on by an external attached mass load at the free end. By using a mechanical wave driver, available in introductory undergraduate laboratories, we provide various experimental results for end loaded cantilever beams that fit reasonably well into a linear equation. The behaviour of the cantilever beam’s weak-damping resonance response is studied for the case of metal resonance strips. As the mass load increases, a more pronounced decrease occurs in the fundamental frequency of beam vibration. It is important to note that cantilever construction is often used in architectural design and engineering construction projects but current analysis also predicts the influence of mass load on the sound generated by musical free reeds with boundary conditions similar to a cantilever beam.

  19. Resonance response of scanning force microscopy cantilevers

    SciTech Connect

    Chen, G.Y.; Warmack, R.J.; Thundat, T.; Allison, D.P. ); Huang, A. )

    1994-08-01

    A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor [ital Q]. Helium has the lowest viscosity, resulting in the highest [ital Q], and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.

  20. Structural investigations on native collagen type I fibrils using AFM

    SciTech Connect

    Strasser, Stefan; Zink, Albert; Janko, Marek; Heckl, Wolfgang M.; Thalhammer, Stefan . E-mail: stefan.thalhammer@gsf.de

    2007-03-02

    This study was carried out to determine the elastic properties of single collagen type I fibrils with the use of atomic force microscopy (AFM). Native collagen fibrils were formed by self-assembly in vitro characterized with the AFM. To confirm the inner assembly of the collagen fibrils, the AFM was used as a microdissection tool. Native collagen type I fibrils were dissected and the inner core uncovered. To determine the elastic properties of collagen fibrils the tip of the AFM was used as a nanoindentor by recording force-displacement curves. Measurements were done on the outer shell and in the core of the fibril. The structural investigations revealed the banding of the shell also in the core of native collagen fibrils. Nanoindentation experiments showed the same Young's modulus on the shell as well as in the core of the investigated native collagen fibrils. In addition, the measurements indicate a higher adhesion in the core of the collagen fibrils compared to the shell.

  1. PREFACE: Non-contact AFM Non-contact AFM

    NASA Astrophysics Data System (ADS)

    Giessibl, Franz J.; Morita, Seizo

    2012-02-01

    This special issue is focussed on high resolution non-contact atomic force microscopy (AFM). Non-contact atomic force microscopy was established approximately 15 years ago as a tool to image conducting and insulating surfaces with atomic resolution. Since 1998, an annual international conference has taken place, and although the proceedings of these conferences are a useful source of information, several key developments warrant devoting a special issue to this subject. In the theoretic field, the possibility of supplementing established techniques such as scanning tunneling microscopy (STM) and Kelvin probe microscopy with atomically resolved force micrsoscopy poses many challenges in the calculation of contrast and contrast reversal. The surface science of insulators, self-assembled monolayers and adsorbates on insulators is a fruitful field for the application of non-contact AFM: several articles in this issue are devoted to these subjects. Atomic imaging and manipulation have been pioneered using STM, but because AFM allows the measurement of forces, AFM has had a profound impact in this field as well. Three-dimensional force spectroscopy has allowed many important insights into surface science. In this issue a combined 3D tunneling and force microscopy is introduced. Non-contact AFM typically uses frequency modulation to measure force gradients and was initially used mainly in a vacuum. As can be seen in this issue, frequency modulation is now also used in ambient conditions, allowing better spatial and force resolution. We thank all of the contributors for their time and efforts in making this special issue possible. We are also very grateful to the staff of IOP Publishing for handling the administrative aspects and for steering the refereeing process. Non-contact AFM contents Relation between the chemical force and the tunnelling current in atomic point contacts: a simple model Pavel Jelínek, Martin Ondrácek and Fernando Flores Theoretical simulation of

  2. High-speed force mapping on living cells with a small cantilever atomic force microscope

    SciTech Connect

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  3. Framed carbon nanostructures: synthesis and applications in functional SPM tips.

    PubMed

    Mukhin, I S; Fadeev, I V; Zhukov, M V; Dubrovskii, V G; Golubok, A O

    2015-01-01

    We present a synthesis method to fabricate framed carbon-based nanostructures having highly anisotropic shapes, in particular, the nanofork and nanoscalpel structures which are obtained systematically under optimized growth conditions. A theoretical model is developed to explain the formation of such nanostructures on Si cantilevers and W etched wires exposed to a focused electron beam. We then demonstrate the potentials of these nanostructures as functional tips for scanning probe microscopy. Owing to their anisotropic shapes, such tips can be very useful for nanolithography, nanosurgery of biological objects, and precise manipulation with surface particles. Overall, our method provides a simple and robust way to produce functional scanning probe microscopy tips with variable shapes and enhanced capabilities for different applications compared to standard cantilevers.

  4. TIP list

    SciTech Connect

    Ludwig, M E

    2006-06-22

    Subcontractors and vendors providing services, including the installation of purchased goods, are required to complete a TIP List. This list does not include every Environment, Safety, and Health (ES&H) related concern at LLNL. It is intended to highlight major concerns common to most on-site service activities.

  5. Technology Tips

    ERIC Educational Resources Information Center

    Stohl, Hollylynne; Harper, Suzanne R.

    2004-01-01

    Some of the graphing capabilities of The Geometer's Sketchpad (GSP) in the "Technology Tips" are introduced. The new graphing features of GSP allow teachers to implement the software not only in geometry classrooms but also into their algebra, precalculus and calculus classes.

  6. Technology Tips

    ERIC Educational Resources Information Center

    Santos-Trigo, Manuel

    2004-01-01

    A dynamic program for geometry called Cabri Geometry II is used to examine properties of figures like triangles and make connections with other mathematical ideas like ellipse. The technology tip includes directions for creating such a problem with technology and suggestions for exploring it.

  7. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    SciTech Connect

    Liu Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-15

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  8. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method.

    PubMed

    Liu, Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-01

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  9. Single-cycle-PLL detection for real-time FM-AFM applications.

    PubMed

    Schlecker, Benedikt; Dukic, Maja; Erickson, Blake; Ortmanns, Maurits; Fantner, Georg; Anders, Jens

    2014-04-01

    In this paper we present a novel architecture for phase-locked loop (PLL) based high-speed demodulation of frequency-modulated (FM) atomic force microscopy (AFM) signals. In our approach, we use single-sideband (SSB) frequency upconversion to translate the AFM signal from the position sensitive detector to a fixed intermediate frequency (IF) of 10 MHz. In this way, we fully benefit from the excellent noise performance of PLL-based FM demodulators still avoiding the intrinsic bandwidth limitation of such systems. In addition, the upconversion to a fixed IF renders the PLL demodulator independent of the cantilever's resonance frequency, allowing the system to work with a large range of cantilever frequencies. To investigate if the additional noise introduced by the SSB upconverter degrades the system noise figure we present a model of the AM-to-FM noise conversion in PLLs incorporating a phase-frequency detector. Using this model, we can predict an upper corner frequency for the demodulation bandwidth above which the converted noise from the single-sideband upconverter becomes the dominant noise source and therefore begins to deteriorate the overall system performance. The approach is validated by both electrical and AFM measurements obtained with a PCB-based prototype implementing the proposed demodulator architecture.

  10. Quantitating membrane bleb stiffness using AFM force spectroscopy and an optical sideview setup.

    PubMed

    Gonnermann, Carina; Huang, Chaolie; Becker, Sarah F; Stamov, Dimitar R; Wedlich, Doris; Kashef, Jubin; Franz, Clemens M

    2015-03-01

    AFM-based force spectroscopy in combination with optical microscopy is a powerful tool for investigating cell mechanics and adhesion on the single cell level. However, standard setups featuring an AFM mounted on an inverted light microscope only provide a bottom view of cell and AFM cantilever but cannot visualize vertical cell shape changes, for instance occurring during motile membrane blebbing. Here, we have integrated a mirror-based sideview system to monitor cell shape changes resulting from motile bleb behavior of Xenopus cranial neural crest (CNC) cells during AFM elasticity and adhesion measurements. Using the sideview setup, we quantitatively investigate mechanical changes associated with bleb formation and compared cell elasticity values recorded during membrane bleb and non-bleb events. Bleb protrusions displayed significantly lower stiffness compared to the non-blebbing membrane in the same cell. Bleb stiffness values were comparable to values obtained from blebbistatin-treated cells, consistent with the absence of a functional actomyosin network in bleb protrusions. Furthermore, we show that membrane blebs forming within the cell-cell contact zone have a detrimental effect on cell-cell adhesion forces, suggesting that mechanical changes associated with bleb protrusions promote cell-cell detachment or prevent adhesion reinforcement. Incorporating a sideview setup into an AFM platform therefore provides a new tool to correlate changes in cell morphology with results from force spectroscopy experiments.

  11. Electromechanical decoupled model for cantilever-beam piezoelectric energy harvesters

    NASA Astrophysics Data System (ADS)

    Tan, T.; Yan, Z.; Hajj, M.

    2016-09-01

    Analysis of cantilever-based piezoelectric energy harvesting systems is usually performed using coupled equations that represent the mechanical displacement and the voltage output. These equations are then solved simultaneously. In contrast to this representation, we use analytical solutions of the governing equation to derive an algebraic equation of the power as a function of the beam displacement, electromechanical coefficients, and the load resistance. Such an equation can be more useful in the design of such harvesters. Particularly, the mechanical displacement is computed from a mechanical governing equation with modified natural frequency and damping ratio that account for the electromechanical coupling. The voltage and the harvested power are then obtained by relating them directly to the mechanical displacement. We validate the proposed analysis by comparing its solution including the tip displacement and harvested power with those of numerical simulations of the governing equations. To demonstrate the generality of the proposed approach, we consider the cases of base excitation, galloping, and autoparametric vibration. The model proposed in this study simplifies the electromechanical coupling problem for practical applications of cantilever-beam piezoelectric energy harvesting systems.

  12. Using metallic noncontact atomic force microscope tips for imaging insulators and polar molecules: tip characterization and imaging mechanisms.

    PubMed

    Gao, David Zhe; Grenz, Josef; Watkins, Matthew Benjamin; Federici Canova, Filippo; Schwarz, Alexander; Wiesendanger, Roland; Shluger, Alexander L

    2014-05-27

    We demonstrate that using metallic tips for noncontact atomic force microscopy (NC-AFM) imaging at relatively large (>0.5 nm) tip-surface separations provides a reliable method for studying molecules on insulating surfaces with chemical resolution and greatly reduces the complexity of interpreting experimental data. The experimental NC-AFM imaging and theoretical simulations were carried out for the NiO(001) surface as well as adsorbed CO and Co-Salen molecules using Cr-coated Si tips. The experimental results and density functional theory calculations confirm that metallic tips possess a permanent electric dipole moment with its positive end oriented toward the sample. By analyzing the experimental data, we could directly determine the dipole moment of the Cr-coated tip. A model representing the metallic tip as a point dipole is described and shown to produce NC-AFM images of individual CO molecules adsorbed onto NiO(001) in good quantitative agreement with experimental results. Finally, we discuss methods for characterizing the structure of metal-coated tips and the application of these tips to imaging dipoles of large adsorbed molecules.

  13. Manufacturing process of nanofluidics using afm probe

    NASA Astrophysics Data System (ADS)

    Karingula, Varun Kumar

    A new process for fabricating a nano fluidic device that can be used in medical application is developed and demonstrated. Nano channels are fabricated using a nano tip in indentation mode on AFM (Atomic Force Microscopy). The nano channels are integrated between the micro channels and act as a filter to separate biomolecules. Nano channels of 4 to7 m in length, 80nm in width, and at varying depths from 100nm to 850 nm allow the resulting device to separate selected groups of lysosomes and other viruses. Sharply developed vertical micro channels are produced from a deep reaction ion etching followed by deposition of different materials, such as gold and polymers, on the top surface, allowing the study of alternative ways of manufacturing a nanofluidic device. PDMS (Polydimethylsiloxane) bonding is performed to close the top surface of the device. An experimental setup is used to test and validate the device by pouring fluid through the channels. A detailed cost evaluation is conducted to compare the economical merits of the proposed process. It is shown that there is a 47:7% manufacturing time savings and a 60:6% manufacturing cost savings.

  14. A study of cantilever-free instrumentation for nanoscale magnetic measurements

    NASA Astrophysics Data System (ADS)

    Altemus, Bruce Adair

    The evolution of the Atomic Force Microscope (AFM) into the Magnetic Force Microscope (MFM) and Magnetic Resonance Force Microscope (MRFM) has had a substantial impact on the characterization of nanoscale phenomena. Detection of 10-17 Newtons per root Hertz has occurred with use of an ultra-sensitive cantilever along with optical interferometry methods within these geometries. The sensitivity of these platforms is dependent on the characteristics of the cantilever, where increased length and a low Young's modulus increase the force sensitivity (meters/newtons). Using IC fabrication techniques, the realization of generating cantilevers with this sensitivity is feasible, but stress compensation layers are required to prevent the free end from curling. Aside from the difficultly in fabrication, the cantilever based approach has one fixed spring constant yielding a finite detectable magnetic force range. An alternative approach incorporating the magnetic levitation of a magnet with an integrated reflector, known as the birdie, has been investigated. The goals of the cantilever-free instrumentation are two fold: (1) To replace the traditional cantilever with a magnetically levitated birdie (which will be scaled down to investigate nanoscale phenomena) through the creation of a virtual cantilever; (2) Investigate the detectable magnetic force range (tunability) of the virtual cantilever. The first 1-D milli-levitation platform has been fabricated and its preliminary characterization has been performed, showing a minimum detectable force in the nano-Newton range with a 10X tunability in spring constant. This high degree of force sensitivity and tunability confirms the design and enables the use for magnetic sample investigation. To further increase the utility of the cantilever-free approach, the birdie has been magnetically levitated in 3D by control circuitry that has been developed and characterized. The magnetic behavior of the custom designed X, Y and Z coil sets

  15. Molecularly imprinted polymer based micromechanical cantilever sensor system for the selective determination of ciprofloxacin.

    PubMed

    Okan, Meltem; Sari, Esma; Duman, Memed

    2017-02-15

    The main objective of this study is to develop molecularly imprinted polymer (MIP) based micromechanical cantilever sensor system that has high specificity, fast response time and is easily applicable by user for the detection of ciprofloxacin (CPX) molecule in water resources. Highly specific CPX imprinted nanoparticles were synthesized by miniemulsion polymerization technique. The average size of the synthesized nanoparticles was measured about 160nm with high monodispersivity. Covalent and monolayer binding of the MIP nanoparticles on cantilevers was provided by EDC/NHS activation. Validation of the developed cantilever nanosensor was performed in air with dip-and-dry technique by employing the dynamic sensing mode. According to the results obtained, micromechanical cantilever sensor system worked linearly for the concentration range of 1.5-150.9μM. This concentration range resulted with 18.4-48.9pg mass load on the MIP modified cantilever. The sensitivity of the developed sensor was calculated as 2.6Hz/pg. To control the specificity of MIPs, a different antibiotic enrofloxacin (ENF), with a similar physical and chemical structure with CPX, was used, which showed 7 folds low binding affinity. The developed highly specific microcantilever sensor has a response time of approximately 2min and is reusable up to 4 times. The results indicate that the MIP based AFM nanosensor has high sensitivity for the CPX molecule. This combination of MIP nanoparticles with micromechanical sensors is one of the pioneer studies in the mass sensing applications. This fast, low cost and highly sensitive CPX specific MIP nanoparticle based nanosensor developed in this research have the potential to pave the way for further studies.

  16. Generation of squeezing: magnetic dipoles on cantilevers

    NASA Astrophysics Data System (ADS)

    Seok, Hyojun; Singh, Swati; Steinke, Steven; Meystre, Pierre

    2011-05-01

    We investigate the generation of motional squeezed states in a nano-mechanical cantilever. Our model system consists of a nanoscale cantilever - whose center-of-mass motion is initially cooled to its quantum mechanical ground state - magnetically coupled a classically driven mechanical tuning fork. We show that the magnetic dipole-dipole interaction can produce significant phonon squeezing of the center-of-mass motion of the cantilever, and evaluate the effect of various dissipation channels, including the coupling of the cantilever to a heat bath and phase and amplitude fluctuations in the oscillating field driving the tuning fork. US National Science Foundation, the US Army Research Office, DARPA ORCHID program through a grant from AFOSR.

  17. Device level 3D characterization using PeakForce AFM

    NASA Astrophysics Data System (ADS)

    Timoney, Padraig; Zhang, Xiaoxiao; Vaid, Alok; Hand, Sean; Osborne, Jason; Milligan, Eric; Feinstein, Adam

    2016-03-01

    Traditional metrology solutions face a range of challenges at the 1X node such as three dimensional (3D) measurement capabilities, shrinking overlay and critical dimension (CD) error budgets driven by multi-patterning and via in trench CD measurements. With advent of advanced technology nodes and 3D processing, an increasing need is emerging for in-die metrology including across-structure and structure-to-structure characterization. A myriad of work has emerged in the past few years intending to address these challenges from various aspects; in-die OCD with reduced spot size and tilt beam on traditional critical dimension scanning electron microscopy (CDSEM) for height measurements. This paper explores the latest capability offered by PeakForceTM Tapping Atomic Force Microscopy (PFT-AFM). The use of traditional harmonic tapping mode for scanning high aspect ratio, and complex "3D" wafer structures, results in limited depth probing capability as well as excessive tip wear. These limitations arise due to the large tip-sample interaction volume in such confined spaces. PeakForce Tapping eliminates these limitations through direct real time control of the tip-sample interaction contact force. The ability of PeakForce to measure, and respond directly to tip- sample interaction forces results in more detailed feature resolution, reduced tip wear, and improved depth capability. In this work, the PFT-AFM tool was applied for multiple applications, including the 14nm fin and replacement metal gate (RMG) applications outlined below. Results from DOE wafers, detailed measurement precision studies and correlation to reference metrology are presented for validation of this methodology. With the fin application, precision of 0.3nm is demonstrated by measuring 5 dies with 10 consecutive runs. Capability to resolve within-die and localized within-macro height variation is also demonstrated. Results obtained from the fin measurements support the increasing trend that measurements

  18. High Performance Open Loop Control of Scanning with a Small Cylindrical Cantilever Beam.

    PubMed

    Kundrat, Matthew J; Reinhall, Per G; Lee, Cameron M; Seibel, Eric J

    2011-04-11

    The steady state response motion of a base excited cantilever beam with circular cross-section excited by a unidirectional displacement will fall along a straight line. However, achieving straight-line motion with a real cantilever beam of circular cross-section is difficult to accomplish. This is due to the fact that nonlinear effects, small deviations from circularity, asymmetric boundary conditions, and actuator cross coupling can induce whirling. The vast majority of previous work on cantilever beam whirling has focused on the effects of system nonlinearities. We show that whirling is a much broader problem in the design of resonant beam scanners in that the onset of whirling does not depend on large amplitude of motion. Rather, whirling is the norm in real systems due to small system asymmetries and actuator cross coupling. It is therefore necessary to control the growth of the whirling motion when a unidirectional beam motion is desired. We have developed a novel technique to identify the two eigen directions of the beam. Base excitation generated by virtual electrodes along these orthogonal eigen axes of the cantilever beam system generates tip vibration without whirl. This leads to accurate open loop control of the motion of the beam through the combined actuation of two pairs of orthogonally placed actuator electrodes.

  19. Study of relaxation and transport processes by means of AFM based dielectric spectroscopy

    SciTech Connect

    Miccio, Luis A.

    2014-05-15

    Since its birth a few years ago, dielectric spectroscopy studies based on atomic force microscopy (AFM) have gained a growing interest. Not only the frequency and temperature ranges have become broader since then but also the kind of processes that can be studied by means of this approach. In this work we analyze the most adequate experimental setup for the study of several dielectric processes with a spatial resolution of a few nanometers by using force mode AFM based dielectric spectroscopy. Proof of concept experiments were performed on PS/PVAc blends and PMMA homopolymer films, for temperatures ranging from 300 to 400 K. Charge transport processes were also studied by this approach. The obtained results were analyzed in terms of cantilever stray contribution, film thickness and relaxation strength. We found that the method sensitivity is strongly coupled with the film thickness and the relaxation strength, and that it is possible to control it by using an adequate experimental setup.

  20. Single-Crystal Diamond Nanowire Tips for Ultrasensitive Force Microscopy.

    PubMed

    Tao, Y; Degen, C L

    2015-12-09

    We report the fabrication, integration, and assessment of sharp diamond tips for ultrasensitive force microscopy experiments. Two types of tips, corresponding to the upper and lower halves of a diamond nanowire, were fabricated by top-down plasma etching from a single-crystalline substrate. The lower, surface-attached halves can be directly integrated into lithographically defined nanostructures, like cantilevers. The upper, detachable halves result in diamond nanowires with a tunable diameter (50-500 nm) and lengths of a few microns. Tip radii were around 10 nm and tip apex angles around 15°. We demonstrate the integration of diamond nanowires for use as scanning tips onto ultrasensitive pendulum-style silicon cantilevers. We find the noncontact friction and frequency jitter to be exceptionally low, with no degradation in the intrinsic mechanical quality factor (Q ≈ 130,000) down to tip-to-surface distances of about 10 nm. Our results are an encouraging step toward further improvement of the sensitivity and resolution of force-detected magnetic resonance imaging.

  1. Penetration of living cell membranes with fortified carbon nanotube tips.

    PubMed

    Vakarelski, Ivan U; Brown, Scott C; Higashitani, Ko; Moudgil, Brij M

    2007-10-23

    We have fabricated robust nanosurgical needles suitable for single cell operations by modifying multiwalled carbon nanotube (MCNT)-terminated atomic force microscopy (AFM) tips. Extra-long MCNT AFM tips were prepared and fortified with molecular layers of carbon to overcome mechanical instabilities and then coated with an outer shell of gold to promote chemical versatility. The terminal diameters of the final fabricated tips were approximately 30-40 nm, and the MCNT probes were several micrometers in length. We illustrate the capability of these modified MCNT tips to carry nanoparticulate payloads and to penetrate the plasma membrane of living pleural mesothelial cells at the smallest indentation depths (100-200 nm) and lowest penetration forces (100-200 pN) currently reported for these procedures.

  2. Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    McCarthy, Brendan; Zhao, Yanming; Grover, Ranjan; Sarid, Dror

    2005-03-01

    Illuminating a silicon cantilever of an atomic force microscope with a focused laser beam creates heat that can be funneled into a nanoscale area at the apex of its tip. To characterize the heating dynamics and measure the temperature of the tip, a Raman scattering pump-and-probe method is used. It is found that at the apex of the tip the intensity of the Raman Stokes and anti-Stokes components are significantly enhanced relative to those obtained on a bulk silicon sample. Modeling the temperature rise at the tip of the cantilever by a closed-form analytical expression gives good agreement with the Raman measurements. This model can be used to design the structure of the cantilever so that the heat delivery to its tip is optimized. Such an optimized cantilever can potentially be used in high-density, heat-assisted magnetic recording, optical data storage using phase-change media and thermomechanical recording systems, for example, where nanoscale heated regions are of importance.

  3. Mechanical properties of graphene cantilever from atomic force microscopy and density functional theory.

    PubMed

    Rasuli, R; Iraji Zad, A; Ahadian, M M

    2010-05-07

    We have studied the mechanical properties of a few-layer graphene cantilever (FLGC) using atomic force microscopy (AFM). The mechanical properties of the suspended FLGC over an open hole have been derived from the AFM data. Force displacement curves using the Derjaguin-Müller-Toporov (DMT) and the massless cantilever beam models yield a Young modulus of E(c) approximately 37, E(a) approximately 0.7 TPa and a Hamakar constant of approximately 3 x 10( - 18) J. The threshold force to shear the FLGC was determined from a breaking force and modeling. In addition, we studied a graphene nanoribbon (GNR), which is a system similar to the FLGC; using density functional theory (DFT). The in-plane Young's modulus for the GNRs were calculated from the DFT outcomes approximately 0.82 TPa and the results were compared with the experiment. We found that the Young's modulus and the threshold shearing force are dependent on the direction of applied force and the values are different for zigzag edge and armchair edge GNRs.

  4. High-speed AFM for 1x node metrology and inspection: Does it damage the features?

    NASA Astrophysics Data System (ADS)

    Sadeghian, Hamed; van den Dool, Teun C.; Uziel, Yoram; Bar Or, Ron

    2015-03-01

    This paper aims at unraveling the mystery of damage in high speed AFMs for 1X node and below. With the device dimensions moving towards the 1X node and below, the semiconductor industry is rapidly approaching the point where existing metrology, inspection and review tools face huge challenges in terms of resolution, the ability to resolve 3D, and throughput. In this paper, we critically asses the important issue of damage in high speed AFM for metrology and inspection of semiconductor wafers. The issues of damage in four major scanning modes (contact mode, tapping mode, non-contact mode, and peak force tapping mode) are described to show which modes are suitable for which applications and which conditions are damaging. The effects of all important scanning parameters on resulting damage are taken into account for materials such as silicon, photoresists and low K materials. Finally, we recommend appropriate scanning parameters and conditions for several use cases (FinFET, patterned photoresist, HAR structures) that avoid exceeding a critical contact stress such that sample damage is minimized. In conclusion, we show using our theoretical analysis that selecting parameters that exceed the target contact stress, indeed leads to significant damage. This method provides AFM users for metrology with a better understanding of contact stresses and enables selection of AFM cantilevers and experimental parameters that prevent sample damage.

  5. Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance.

    PubMed

    Arima, Eiji; Naitoh, Yoshitaka; Li, Yan Jun; Yoshimura, Satoru; Saito, Hitoshi; Nomura, Hikaru; Nakatani, Ryoichi; Sugawara, Yasuhiro

    2015-03-27

    In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.

  6. Biophysical properties of cardiomyocyte surface explored by multiparametric AFM.

    PubMed

    Smolyakov, Georges; Cauquil, Marie; Severac, Childerick; Lachaize, Véronique; Guilbeau-Frugier, Céline; Sénard, Jean-Michel; Galés, Céline; Dague, Etienne

    2017-03-02

    PeakForce Quantitative Nanomechanical Mapping (PeakForce QNM) multiparametric AFM mode was adapted to qualitative and quantitative study of the lateral membrane of cardiomyocytes (CMs), extending this powerful mode to the study of soft cells. On living CM, PeakForce QNM depicted the crests and hollows periodic alternation of cell surface architecture previously described using AFM Force Volume (FV) mode. PeakForce QNM analysis provided better resolution in terms of pixel number compared to FV mode and reduced acquisition time, thus limiting the consequences of spontaneous living adult CM dedifferentiation once isolated from the cardiac tissue. PeakForce QNM mode on fixed CMs clearly visualized subsarcolemmal mitochondria (SSM) and their loss following formamide treatment, concomitant with the interfibrillar mitochondria climbing up and forming heaps at the cell surface. Interestingly, formamide-promoted SSM loss allowed visualization of the sarcomeric apparatus ultrastructure below the plasma membrane. High PeakForce QNM resolution led to better contrasted mechanical maps than FV mode and provided correlation between adhesion, dissipation, mechanical and topographical maps. Modified hydrophobic AFM tip enhanced contrast on adhesion and dissipation maps and suggested that CM surface crests and hollows exhibit distinct chemical properties. Finally, two-dimensional Fast Fourier Transform to objectively quantify AFM maps allowed characterization of periodicity of both sarcomeric Z-line and M-band. Overall, this study validated PeakForce QNM as a valuable and innovative mode for the exploration of living and fixed CMs. In the future, it could be applied to depict cell membrane architectural, mechanical and chemical defects as well as sarcomeric abnormalities associated with cardiac diseases.

  7. Dual-tip magnetic force microscopy with suppressed influence on magnetically soft samples.

    PubMed

    Precner, Marián; Fedor, Ján; Šoltýs, Ján; Cambel, Vladimír

    2015-02-06

    Standard magnetic force microscopy (MFM) is considered as a powerful tool used for magnetic field imaging at nanoscale. The method consists of two passes realized by the magnetic tip. Within the first one, the topography pass, the magnetic tip directly touches the magnetic sample. Such contact perturbs the magnetization of the sample explored. To avoid the sample touching the magnetic tip, we present a new approach to magnetic field scanning by segregating the topological and magnetic scans with two different tips located on a cut cantilever. The approach minimizes the disturbance of sample magnetization, which could be a major problem in conventional MFM images of soft magnetic samples. By cutting the cantilever in half using the focused ion beam technique, we create one sensor with two different tips--one tip is magnetized, and the other one is left non-magnetized. The non-magnetized tip is used for topography and the magnetized one for the magnetic field imaging. The method developed we call dual-tip magnetic force microscopy (DT-MFM). We describe in detail the dual-tip fabrication process. In the experiments, we show that the DT-MFM method reduces significantly the perturbations of the magnetic tip as compared to the standard MFM method. The present technique can be used to investigate microscopic magnetic domain structures in a variety of magnetic samples and is relevant in a wide range of applications, e.g., data storage and biomedicine.

  8. A soft-polymer piezoelectric bimorph cantilever-actuated peristaltic micropump.

    PubMed

    Graf, Neil J; Bowser, Michael T

    2008-10-01

    A peristaltic micropump was fabricated and characterized. The micropump was fabricated using soft lithography, and actuated using piezoelectric bimorph cantilevers. The micropump channel was formed by bonding two layers of PDMS, mixed at 5:1 and 30:1 ratios. The channel was fabricated in the 5:1 layer using replica molding (REM), where a very simple and inexpensive template was made by straddling a 75 microm wire over a glass substrate, followed by covering and smoothing over the wire with a piece of aluminium foil. Not only was this template inexpensive and extremely simple to fabricate, it also created a rounded cross-sectional geometry which is favorable for complete valve shutoff. The cantilevers were driven at Vp=+/-90 V with amplified square wave signals generated by a virtual function generator created in LabVIEW. Connections to the micropump were made by placing capillary tubes in the channel, and then sealed between the two layers of PDMS. Machined aluminium clamps were adhered to the tips of the cantilevers with general purpose adhesive. These clamps allowed for aluminium valves, with finely machined tips of dimensions 3 mm by 200 microm, to be held firmly in place. The variables characterized for this micropump were flow rate, maximum attainable backpressure, free cantilever deflection, valve shutoff, and valve leakage. Three actuation patterns with phase differences of 60, 90, and 120 degrees were compared for flow rate and maximum backpressure. It was determined that the 120 degrees signal outperformed the 60 degrees and 90 degrees signals for both maximum flowrate and maximum attainable backpressure. The maximum and minimum flowrates demonstrated by the micropump were 289 nL min(-1) and 53 nL min(-1), respectively. The maximum backpressure attained was 35 300 Pa. It was also demonstrated that the valves fully closed the channels upon actuation, with minimal observed leakage.

  9. An experimentally validated bimorph cantilever model for piezoelectric energy harvesting from base excitations

    NASA Astrophysics Data System (ADS)

    Erturk, A.; Inman, D. J.

    2009-02-01

    Piezoelectric transduction has received great attention for vibration-to-electric energy conversion over the last five years. A typical piezoelectric energy harvester is a unimorph or a bimorph cantilever located on a vibrating host structure, to generate electrical energy from base excitations. Several authors have investigated modeling of cantilevered piezoelectric energy harvesters under base excitation. The existing mathematical modeling approaches range from elementary single-degree-of-freedom models to approximate distributed parameter solutions in the sense of Rayleigh-Ritz discretization as well as analytical solution attempts with certain simplifications. Recently, the authors have presented the closed-form analytical solution for a unimorph cantilever under base excitation based on the Euler-Bernoulli beam assumptions. In this paper, the analytical solution is applied to bimorph cantilever configurations with series and parallel connections of piezoceramic layers. The base excitation is assumed to be translation in the transverse direction with a superimposed small rotation. The closed-form steady state response expressions are obtained for harmonic excitations at arbitrary frequencies, which are then reduced to simple but accurate single-mode expressions for modal excitations. The electromechanical frequency response functions (FRFs) that relate the voltage output and vibration response to translational and rotational base accelerations are identified from the multi-mode and single-mode solutions. Experimental validation of the single-mode coupled voltage output and vibration response expressions is presented for a bimorph cantilever with a tip mass. It is observed that the closed-form single-mode FRFs obtained from the analytical solution can successfully predict the coupled system dynamics for a wide range of electrical load resistance. The performance of the bimorph device is analyzed extensively for the short circuit and open circuit resonance

  10. Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching method

    PubMed Central

    2014-01-01

    This letter presents a novel atomic force microscopy (AFM)-based nanomanufacturing method combining the tip scanning with the high-precision stage movement to fabricate nanochannels with ladder nanostructure at the bottom by continuous scanning with a fixed scan size. Different structures can be obtained according to the matching relation of the tip feeding velocity and the precision stage moving velocity. This relationship was first studied in detail to achieve nanochannels with different ladder nanostructures at the bottom. Machining experiments were then performed to fabricate nanochannels on an aluminum alloy surface to demonstrate the capability of this AFM-based fabrication method presented in this study. Results show that the feed value and the tip orientation in the removing action play important roles in this method which has a significant effect on the machined surfaces. Finally, the capacity of this method to fabricate a large-scale nanochannel was also demonstrated. This method has the potential to advance the existing AFM tip-based nanomanufacturing technique of the formation these complex structures by increasing the removal speed, simplifying the processing procedure and achieving the large-scale nanofabrication. PMID:24940171

  11. Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.

    PubMed

    Sahin, Ozgur

    2007-10-01

    Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.

  12. 2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    2. DETAIL OF STRUCTURAL SYSTEM FOR CANTILEVERED HOG RUN; BUILDING 168 (1960 HOG KILL) IS BENEATH HOG RUN - Rath Packing Company, Cantilevered Hog Run, Sycamore Street between Elm & Eighteenth Streets, Waterloo, Black Hawk County, IA

  13. Physics-based signal processing algorithms for micromachined cantilever arrays

    DOEpatents

    Candy, James V; Clague, David S; Lee, Christopher L; Rudd, Robert E; Burnham, Alan K; Tringe, Joseph W

    2013-11-19

    A method of using physics-based signal processing algorithms for micromachined cantilever arrays. The methods utilize deflection of a micromachined cantilever that represents the chemical, biological, or physical element being detected. One embodiment of the method comprises the steps of modeling the deflection of the micromachined cantilever producing a deflection model, sensing the deflection of the micromachined cantilever and producing a signal representing the deflection, and comparing the signal representing the deflection with the deflection model.

  14. Self-heating in piezoresistive cantilevers

    PubMed Central

    Doll, Joseph C.; Corbin, Elise A.; King, William P.; Pruitt, Beth L.

    2011-01-01

    We report experiments and models of self-heating in piezoresistive microcantilevers that show how cantilever measurement resolution depends on the thermal properties of the surrounding fluid. The predicted cantilever temperature rise from a finite difference model is compared with detailed temperature measurements on fabricated devices. Increasing the fluid thermal conductivity allows for lower temperature operation for a given power dissipation, leading to lower force and displacement noise. The force noise in air is 76% greater than in water for the same increase in piezoresistor temperature. PMID:21731884

  15. Tips for Daily Living

    MedlinePlus

    ... Tips and Gadgets for Daily Activities Dressing Tips Shopping Tips Modifying the Bathroom Driving After Stroke Medication ... and resources. Find a group in your area . Online Support If there is not a support group ...

  16. First Aid Tips

    MedlinePlus

    ... NEI for Kids > First Aid Tips All About Vision About the Eye Ask a Scientist Video Series ... Eye Health and Safety First Aid Tips Healthy Vision Tips Protective Eyewear Sports and Your Eyes Fun ...

  17. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

    SciTech Connect

    Sader, John E.; Friend, James R.

    2015-05-15

    Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

  18. Thermoelastic Analysis of a Vibrating TiB/Ti Cantilever Beam Using Differential Thermography

    SciTech Connect

    Byrd, Larry; Wyen, Travis; Byrd, Alex

    2008-02-15

    Differential thermography has been used to detect the fluctuating temperatures due the thermoelastic effect for a number of years. This paper examines functionally graded TiB/Ti cantilever beams excited on an electromechanical shaker in fully reversed bending. Finite difference analysis of specimens was used to look at the effect of heat conduction, convection and the fundamental frequency on the surface temperature distribution and compared to experimental data. The thermoelastic effect was also used to detect cracking and the stress field at the tip of the fixture during fatigue.

  19. Forced Vibrations of a Cantilever Beam

    ERIC Educational Resources Information Center

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-01-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is "downwards", i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping…

  20. AFM study of forces between silica, silicon nitride and polyurethane pads.

    PubMed

    Sokolov, Igor; Ong, Quy K; Shodiev, Hasan; Chechik, Nina; James, David; Oliver, Mike

    2006-08-15

    Interaction of silica and silicon nitride with polyurethane surfaces is rather poorly studied despite being of great interest for modern semiconductor industry, e.g., for chemical-mechanical planarization (CMP) processes. Here we show the results from the application of the atomic force microscopy (AFM) technique to study the forces between silica or silicon nitride (AFM tips) and polyurethane surfaces in aqueous solutions of different acidity. The polyurethane surface potentials are derived from the measured AFM data. The obtained potentials are in rather good agreement with measurements of zeta-potentials using the streaming-potentials method. Another important parameter, adhesion, is also measured. While the surface potentials of silica are well known, there are ambiguous results on the potentials of silicon nitride that is naturally oxidized. Deriving the surface potential of the naturally oxidized silicon nitride from our measurements, we show that it is not oxidized to silica despite some earlier published expectations.

  1. Direct and alignment-insensitive measurement of cantilever curvature

    SciTech Connect

    Hermans, Rodolfo I.; Aeppli, Gabriel; Bailey, Joe M.

    2013-07-15

    We analytically derive and experimentally demonstrate a method for the simultaneous measurement of deflection for large arrays of cantilevers. The Fresnel diffraction patterns of a cantilever independently reveal tilt, curvature, cubic, and higher order bending of the cantilever. It provides a calibrated absolute measurement of the polynomial coefficients describing the cantilever shape, without careful alignment and could be applied to several cantilevers simultaneously with no added complexity. We show that the method is easily implemented, works in both liquid media and in air, for a broad range of displacements and is especially suited to the requirements for multi-marker biosensors.

  2. Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type II superlattice FPAs

    NASA Astrophysics Data System (ADS)

    Rotter, T. J.; Busani, T.; Rathi, P.; Jaeckel, F.; Reyes, P. A.; Malloy, K. J.; Ukhanov, A. A.; Plis, E.; Krishna, S.; Jaime-Vasquez, M.; Baril, N. F.; Benson, J. D.; Tenne, D. A.

    2015-06-01

    We propose to utilize confocal Raman spectroscopy combined with high resolution atomic force microscopy (AFM) for nondestructive characterisation of the sidewalls of etched and passivated small pixel (24 μm×24 μm) focal plane arrays (FPA) fabricated using LW/LWIR InAs/GaSb type-II strained layer superlattice (T2SL) detector material. Special high aspect ratio Si and GaAs AFM probes, with tip length of 13 μm and tip aperture less than 7°, allow characterisation of the sidewall morphology. Confocal microscopy enables imaging of the sidewall profile through optical sectioning. Raman spectra measured on etched T2SL FPA single pixels enable us to quantify the non-uniformity of the mesa delineation process.

  3. Electromechanical decoupled model for cantilever-beam piezoelectric energy harvesters with inductive-resistive circuits and its application in galloping mode

    NASA Astrophysics Data System (ADS)

    Tan, Ting; Yan, Zhimiao

    2017-03-01

    The electromechanical decoupled distributed parameter model for cantilever-beam piezoelectric energy harvesters with inductive-resistive circuits is proposed. The modified natural frequency and electrical damping for series and parallel inductive-resistive cases are derived, which are functions of the first natural frequency of the cantilever beam, capacitance of the piezoelectric layers, load resistance, inductance and electromechanical coupling term. As a demonstration, we apply the decoupled model to cantilever-beam piezoelectric energy harvesters operated in the galloping mode. The average harvested power is derived as an algebraic expression of the electrical damping in addition to the wind speed, aerodynamic parameters of the bluff body and mechanical properties of the cantilever beam. Besides these impacts, the amplitude of the tip displacement also depends on its modified natural frequency. The electromechanical decoupled model and its analytical solutions are confirmed by the numerical solutions of the coupled model for the galloping mode. The theoretical expressions for the maximal harvested power and corresponding tip displacement at the optimal electrical damping are then developed. The cantilever-beam piezoelectric energy harvester with the inductive-resistive circuit has multiple solution sets of the modified natural frequency and electrical damping. Any optimal electrical damping can be realized by series or parallel inductive-resistive circuit, which cannot be accomplished by pure resistive circuit. By introducing the inductance to the circuit of the galloping piezoelectric energy harvester, the performance of such a system is improved with larger maximal harvested power at high wind speed and smaller amplitude of the tip displacement. This study provides a theoretical approach to capture the intrinsic effects of the inductance in addition to the load resistance on the performance of cantilever-beam piezoelectric energy harvesters.

  4. Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range.

    PubMed

    Zhou, Yusheng; Shang, Guangyi; Cai, Wei; Yao, Jun-en

    2010-05-01

    A cantilevered bimorph-based resonance-mode scanner for high speed atomic force microscope (AFM) imaging is presented. The free end of the bimorph is used for mounting a sample stage and the other one of that is fixed on the top of a conventional single tube scanner. High speed scanning is realized with the bimorph-based scanner vibrating at resonant frequency driven by a sine wave voltage applied to one piezolayer of the bimorph, while slow scanning is performed by the tube scanner. The other piezolayer provides information on vibration amplitude and phase of the bimorph itself simultaneously, which is used for real-time data processing and image calibration. By adjusting the free length of the bimorph, the line scan rate can be preset ranging from several hundred hertz to several kilohertz, which would be beneficial for the observation of samples with different properties. Combined with a home-made AFM system and a commercially available data acquisition card, AFM images of various samples have been obtained, and as an example, images of the silicon grating taken at a line rate of 1.5 kHz with the scan size of 20 microm are given. By manually moving the sample of polished Al foil surface while scanning, the capability of dynamic imaging is demonstrated.

  5. Aptamer-based cantilever array sensors for oxytetracycline detection.

    PubMed

    Hou, Hui; Bai, Xiaojing; Xing, Chunyan; Gu, Ningyu; Zhang, Bailin; Tang, Jilin

    2013-02-19

    We present a new method for specific detection of oxytetracycline (OTC) at nanomolar concentrations based on a microfabricated cantilever array. The sensing cantilevers in the array are functionalized with self-assembled monolayers (SAMs) of OTC-specific aptamer, which acts as a recognition molecule for OTC. While the reference cantilevers in the array are functionalized with 6-mercapto-1-hexanol SAMs to eliminate the influence of environmental disturbances. The cantilever sensor shows a good linear relationship between the deflection amplitude and the OTC concentration in the range of 1.0-100 nM. The detection limit of the cantilever array sensor is as low as 0.2 nM, which is comparable to some traditional methods. Other antibiotics such as doxycycline and tetracycline do not cause significant deflection of the cantilevers. It is demonstrated that the cantilever array sensors can be used as a powerful tool to detect drugs with high sensitivity and selectivity.

  6. First-principles AFM image simulation with frozen density embedding theory

    NASA Astrophysics Data System (ADS)

    Sakai, Yuki; Lee, Alex J.; Chelikowsky, James R.

    We present efficient first-principles method of non-contact atomic force microscopy (nc-AFM). Ordinary nc-AFM simulations based on density functional theory (DFT) require exhaustive computational cost because it involves thousands of total energy calculations. Regarding the sample as a fixed external potential can reduce the computational cost, and we adopt frozen density embedding theory (FDET) for this purpose. Simulated nc-AFM images with FDET using a carbon monoxide tip well reproduces the full DFT images of benzene, pentacene, and graphene, although optimized tip-sample distances and interaction energies in FDET are underestimated and overestimated, respectively. The FDET-based simulation method is promising for AFM image simulation of surfaces and two-dimensional materials. This work was supported by U.S. DOE under Grant No. DE-FG02-06ER46286 and Award No. DE-SC0008877, and by Welch Foundation under Grant F-1837. Computational resources are provided by NERSC and TACC.

  7. Tips for Transition

    ERIC Educational Resources Information Center

    Kellems, Ryan, Comp.; Morningstar, Mary E., Comp.

    2009-01-01

    The Tips for Transition contains 134 Transition Tips submitted from all over the country by practitioners. The purpose of the Tips was to identify grassroots transition practices being used by practitioners. Tips are categorized into the following domains: (1) Transition Planning; (2) Student Involvement; (3) Family Involvement; (4) Curriculum and…

  8. Photoswitching behavior of a novel single molecular tip for noncontact atomic force microscopy designed for chemical identification.

    PubMed

    Takamatsu, Daiko; Yamakoshi, Yoko; Fukui, Ken-ichi

    2006-02-09

    A tripod molecule with an azobenzene arm was designed as a single molecular tip for noncontact atomic force microscopy (NC-AFM). The azobenzene moiety showed photoisomerization that enabled measurements of the same position of the sample by different tip apexes with different interactions. Photoswitching behavior of the molecule synthesized and adsorbed on Au surfaces was examined and reversible switching between the trans- and cis forms was successfully confirmed by NC-AFM measurements.

  9. Probe tip heating assembly

    SciTech Connect

    Schmitz, Roger William; Oh, Yunje

    2016-10-25

    A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.

  10. Cantilevered single walled boron nitride nanotube based nanomechanical resonators of zigzag and armchair forms

    NASA Astrophysics Data System (ADS)

    Panchal, Mitesh B.; Upadhyay, S. H.

    2013-05-01

    In this paper, the dynamic response analysis of single walled boron nitride nanotubes (SWBNNTs) has been done using a finite element method (FEM). To this end, different types of zigzag and armchair layups of SWBNNTs are considered with cantilever configuration to analyze the mass detection application, as a SWBNNT based nanomechanical resonator. Using three dimensional elastic beams and point masses, single walled boron nitride nanotubes are approximated as atomistic finite element models. Implementing the finite element simulation approach, the resonant frequency of cantilevered nanotubes obtained and observed the shifts in it mainly due to an additional nanoscale mass to the nanotube tip. The effect on resonant frequency shift due to dimensional variation in terms of length as well as diameter is explored by considering different aspect ratios of nanotubes. The effect of intermediate landing positions of added mass on resonant frequency shift is also analyzed by considering excitations of different modes of vibration. Also, the effect of chiralities compared for resonant frequency variations to check the effect on sensitivity due to different forms of SWBNNTs. The present approach is found to be effectual in terms of dealing different chiralities, boundary conditions and consideration of added mass to analyze the dynamic behavior of cantilevered SWBNNT based nanomechanical resonators. The simulation results are compared with the analytical results based on continuum mechanics and found in good agreement as one of the toolkits for systematic analysis approach for novel design of SWBNNT based nanomechanical resonators for wide range of applications.

  11. Application of a passive/active autoparametric cantilever beam absorber with PZT actuator for Duffing systems

    NASA Astrophysics Data System (ADS)

    Silva-Navarro, G.; Abundis-Fong, H. F.; Vazquez-Gonzalez, B.

    2013-04-01

    An experimental investigation is carried out on a cantilever-type passive/active autoparametric vibration absorber, with a PZT patch actuator, to be used in a primary damped Duffing system. The primary system consists of a mass, viscous damping and a cubic stiffness provided by a soft helical spring, over which is mounted a cantilever beam with a PZT patch actuator actively controlled to attenuate harmonic and resonant excitation forces. With the PZT actuator on the cantilever beam absorber, cemented to the base of the beam, the auto-parametric vibration absorber is made active, thus enabling the possibility to control the effective stiffness and damping associated to the passive absorber and, as a consequence, the implementation of an active vibration control scheme able to preserve, as possible, the autoparametric interaction as well as to compensate varying excitation frequencies and parametric uncertainty. This active vibration absorber employs feedback information from a high resolution optical encoder on the primary Duffing system and an accelerometer on the tip beam absorber, a strain gage on the base of the beam, feedforward information from the excitation force and on-line computations from the nonlinear approximate frequency response, parameterized in terms of a proportional gain provided by a voltage input to the PZT actuator, thus modifying the closed-loop dynamic stiffness and providing a mechanism to asymptotically track an optimal, robust and stable attenuation solution on the primary Duffing system. Experimental results are included to describe the dynamic and robust performance of the overall closed-loop system.

  12. An improved measurement of dsDNA elasticity using AFM

    NASA Astrophysics Data System (ADS)

    Nguyen, Thi-Huong; Lee, Sang-Myung; Na, Kyounghwan; Yang, Sungwook; Kim, Jinseok; Yoon, Eui-Sung

    2010-02-01

    The mechanical properties of a small fragment (30 bp) of an individual double-stranded deoxyribonucleic acid (dsDNA) in water have been investigated by atomic force microscopy (AFM). We have stretched three systems including ssDNA, double-fixed dsDNA (one strand of the dsDNA molecules was biotinylated at the 3'-end and thiolated at the 5'-end, this was reversed for the other complementary strand) and single-fixed dsDNA (one strand of the dsDNA molecules was biotinylated at the 3'-end and thiolated at the 5'-end, whereas the other complementary strand was biotinylated at only the 5'-end). The achieved thiolation and biotinylation were to bind ds- or ssDNA to the gold surface and streptavidin-coated AFM tip, respectively. Analysis of the force versus displacement (F-D) curves from tip-DNA-substrate systems shows that the pull-off length (Lo) and stretch length (δ) from the double-fixed system were shorter than those observed in the ssDNA and the single-fixed system. The obtained stretch force (Fst) from the single-fixed dsDNA was much greater than that from the ssDNA even though it was about 10 pN greater than the one obtained in the double-fixed system. As a result, the Young's modulus of the double-fixed dsDNA was greater than that of the single-fixed dsDNA and the ssDNA. A more reliable stiffness of the dsDNA was observed via the double-fixed system, since there is no effect of the unpaired molecules during stretching, which always occurred in the single-fixed system. The unpaired molecules were also observed by comparing the stiffness of ssDNA and single-fixed dsDNA in which the end of one strand was left free.

  13. A low-cost AFM setup with an interferometer for undergraduates and secondary-school students

    NASA Astrophysics Data System (ADS)

    Bergmann, Antje; Feigl, Daniela; Kuhn, David; Schaupp, Manuel; Quast, Günter; Busch, Kurt; Eichner, Ludwig; Schumacher, Jens

    2013-07-01

    Atomic force microscopy (AFM) is an important tool in nanotechnology. This method makes it possible to observe nanoscopic surfaces beyond the resolution of light microscopy. In order to provide undergraduate and secondary-school students with insights into this world, we have developed a very robust low-cost AFM setup with a Fabry-Perot interferometer as a detecting device. This setup is designed to be operated almost completely manually and its simplicity gives access to a profound understanding of the working principle. Our AFM is operated in a constant height mode, i.e. the topography of the sample surface is represented directly by the deflection of the cantilever. Thus, the measuring procedure can be understood even by secondary-school students; furthermore, it is the method with the lowest cost, totalling not more than 10-15 k Euros. Nevertheless, we are able to examine a large variety of sample topographies such as CD and DVD surfaces, IC structures, blood cells, butterfly wings or moth eyes. Furthermore, force-distance curves can be recorded and the tensile moduli of some materials can be evaluated. We present our setup in detail and describe its working principles. In addition, we show various experiments which have already been performed by students.

  14. A novel dog-bone oscillating AFM probe with thermal actuation and piezoresistive detection.

    PubMed

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-10-31

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments.

  15. A Novel Dog-Bone Oscillating AFM Probe with Thermal Actuation and Piezoresistive Detection †

    PubMed Central

    Xiong, Zhuang; Mairiaux, Estelle; Walter, Benjamin; Faucher, Marc; Buchaillot, Lionel; Legrand, Bernard

    2014-01-01

    In order to effectively increase the resonance frequency and the quality factor of atomic force microscope (AFM) probes, a novel oscillating probe based on a dog-bone shaped MEMS resonator was conceived, designed, fabricated and evaluated. The novel probe with 400 μm in length, 100 μm in width and 5 μm in thickness was enabled to feature MHz resonance frequencies with integrated thermal actuation and piezoresistive detection. Standard silicon micromachining was employed. Both electrical and optical measurements were carried out in air. The resonance frequency and the quality factor of the novel probe were measured to be 5.4 MHz and 4000 respectively, which are much higher than those (about several hundreds of kHz) of commonly used cantilever probes. The probe was mounted onto a commercial AFM set-up through a dedicated probe-holder and circuit board. Topographic images of patterned resist samples were obtained. It is expected that the resonance frequency and the measurement bandwidth of such probes will be further increased by a proper downscaling, thus leading to a significant increase in the scanning speed capability of AFM instruments. PMID:25365463

  16. AFM observation of monatomic step movements on NaCl(001) with the help of adsorbed water

    NASA Astrophysics Data System (ADS)

    Shindo, H.; Ohashi, M.; Baba, K.; Seo, A.

    1996-06-01

    AFM observation of cleaved NaCl(001) surface in air at room temperature revealed spontaneous motion of monatomic steps, depending on relative humidity, to minimize one-dimensional surface free energy. While step motion was recognized only at the parts having large positive curvature at 52% humidity, even straight steps moved at 57%. The motion was accelerated toward higher humidity. It is suggested that adsorbed water having 2-dimensional nature transports ions at the surface. By holding the AFM tip at one place, salt solution was collected beneath the tip by capillary action. Upon removal of the tip, the solution droplet turned into a bell-shaped hillock of salt as high as 78 nm. Although the hillocks gradually flattened spontaneously, the method has potential application in pattern formation.

  17. Linear and Nonlinear Photoinduced Deformations of Cantilevers

    NASA Astrophysics Data System (ADS)

    Corbett, D.; Warner, M.

    2007-10-01

    Glassy and elastomeric nematic networks with dye molecules present can be very responsive to illumination, huge reversible strains being possible. If absorption is appreciable, strain decreases with depth into a cantilever, leading to bend that is the basis of micro-opto-mechanical systems (MOMS). Bend actually occurs even when Beer’s law suggests a tiny penetration of light into a heavily dye-doped system. We model the nonlinear opto-elastic processes behind this effect. In the regime of cantilever thickness giving optimal bending for a given incident light intensity, there are three neutral surfaces. In practice such nonlinear absorptive effects are very important since heavily doped systems are commonly used.

  18. Cantilever mounted resilient pad gas bearing

    NASA Technical Reports Server (NTRS)

    Etsion, I. (Inventor)

    1978-01-01

    A gas-lubricated bearing is described, employing at least one pad mounted on a rectangular cantilever beam to produce a lubricating wedge between the face of the pad and a moving surface. The load-carrying and stiffness characteristics of the pad are related to the dimensions and modulus of elasticity of the beam. The bearing is applicable to a wide variety of types of hydrodynamic bearings.

  19. Lead-Free Piezoelectric MEMS Energy Harvesters of (K,Na)NbO3 Thin Films on Stainless Steel Cantilevers

    NASA Astrophysics Data System (ADS)

    Tsujiura, Yuichi; Suwa, Eisaku; Kurokawa, Fumiya; Hida, Hirotaka; Suenaga, Kazufumi; Shibata, Kenji; Kanno, Isaku

    2013-09-01

    We fabricated piezoelectric MEMS energy harvesters (EHs) of lead-free (K,Na)NbO3 (KNN) thin films on microfabricated stainless steel cantilevers. The use of metal substrates makes it possible to fabricate thin cantilevers owing to a large fracture toughness compared with Si substrates. KNN films were directly deposited onto Pt-coated stainless steel cantilevers by rf-magnetron sputtering, thereby simplifying the fabrication process of the EHs. From XRD measurement, we confirmed that the KNN films on Pt-coated stainless steel cantilevers had a perovskite structure with a preferential (001) orientation. The transverse piezoelectric coefficient e31f and relative dielectric constant ɛr were measured to be -3.8 C/m2 and 409, respectively. From the evaluation of the power generation performance of a KNN thin-film EH (length: 7.5 mm, width: 5.0 mm, weight of tip mass: 25 mg), we obtained a large average output power of 1.6 µW under vibration at 393 Hz and 10 m/s2.

  20. Crack Identification of Cantilever Plates Based on a Kriging Surrogate Model.

    PubMed

    Gao, Haiyang; Guo, Xinglin; Ouyang, Huajiang; Han, Fang

    2013-10-01

    This work presents an effective method to identify the tip locations of an internal crack in cantilever plates based on a Kriging surrogate model. Samples of varying crack parameters (tip locations) and their corresponding root mean square (RMS) of random responses are used to construct the initial Kriging surrogate model. Moreover, the pseudo excitation method (PEM) is employed to speed up the spectral analysis. For identifying crack parameters based on the constructed Kriging model, a robust stochastic particle swarm optimization (SPSO) algorithm is adopted for enhancing the global searching ability. To improve the accuracy of the surrogate model without using extensive samples, a small number of samples are first used. Then an optimal point-adding process is carried out to reduce computational cost. Numerical studies of a cantilever plate with an internal crack are performed. The effectiveness and efficiency of this method are demonstrated by the identified results. The effect of initial sampling size on the precision of the identified results is also investigated.

  1. Analytical solutions to the free vibration of a double-walled carbon nanotube carrying a bacterium at its tip

    NASA Astrophysics Data System (ADS)

    Storch, Joel A.; Elishakoff, Isaac

    2013-11-01

    We calculate the natural frequencies and mode shapes of a cantilevered double-walled carbon nanotube carrying a rigid body—representative of a bacterium or virus—at the tip of the outer nanotube. By idealizing the nanotubes as Bernoulli-Euler beams, we are able to obtain exact expressions for both the mode shapes and characteristic frequency equation. Separate analyses are performed for the special case of a concentrated tip mass and the more complicated situation where the tip body also exhibits inertia and mass center offset from the beam tip.

  2. Nano Mechanical Machining Using AFM Probe

    NASA Astrophysics Data System (ADS)

    Mostofa, Md. Golam

    Complex miniaturized components with high form accuracy will play key roles in the future development of many products, as they provide portability, disposability, lower material consumption in production, low power consumption during operation, lower sample requirements for testing, and higher heat transfer due to their very high surface-to-volume ratio. Given the high market demand for such micro and nano featured components, different manufacturing methods have been developed for their fabrication. Some of the common technologies in micro/nano fabrication are photolithography, electron beam lithography, X-ray lithography and other semiconductor processing techniques. Although these methods are capable of fabricating micro/nano structures with a resolution of less than a few nanometers, some of the shortcomings associated with these methods, such as high production costs for customized products, limited material choices, necessitate the development of other fabricating techniques. Micro/nano mechanical machining, such an atomic force microscope (AFM) probe based nano fabrication, has, therefore, been used to overcome some the major restrictions of the traditional processes. This technique removes material from the workpiece by engaging micro/nano size cutting tool (i.e. AFM probe) and is applicable on a wider range of materials compared to the photolithographic process. In spite of the unique benefits of nano mechanical machining, there are also some challenges with this technique, since the scale is reduced, such as size effects, burr formations, chip adhesions, fragility of tools and tool wear. Moreover, AFM based machining does not have any rotational movement, which makes fabrication of 3D features more difficult. Thus, vibration-assisted machining is introduced into AFM probe based nano mechanical machining to overcome the limitations associated with the conventional AFM probe based scratching method. Vibration-assisted machining reduced the cutting forces

  3. Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM

    NASA Astrophysics Data System (ADS)

    Zandiatashbar, Ardavan; Taylor, Patrick A.; Kim, Byong; Yoo, Young-kook; Lee, Keibock; Jo, Ahjin; Lee, Ju Suk; Cho, Sang-Joon; Park, Sang-il

    2016-03-01

    Single crystal silicon wafers are the fundamental elements of semiconductor manufacturing industry. The wafers produced by Czochralski (CZ) process are very high quality single crystalline materials with known defects that are formed during the crystal growth or modified by further processing. While defects can be unfavorable for yield for some manufactured electrical devices, a group of defects like oxide precipitates can have both positive and negative impacts on the final device. The spatial distribution of these defects may be found by scattering techniques. However, due to limitations of scattering (i.e. light wavelength), many crystal defects are either poorly classified or not detected. Therefore a high throughput and accurate characterization of their shape and dimension is essential for reviewing the defects and proper classification. While scanning electron microscopy (SEM) can provide high resolution twodimensional images, atomic force microscopy (AFM) is essential for obtaining three-dimensional information of the defects of interest (DOI) as it is known to provide the highest vertical resolution among all techniques [1]. However AFM's low throughput, limited tip life, and laborious efforts for locating the DOI have been the limitations of this technique for defect review for 300 mm wafers. To address these limitations of AFM, automatic defect review AFM has been introduced recently [2], and is utilized in this work for studying DOI on 300 mm silicon wafer. In this work, we carefully etched a 300 mm silicon wafer with a gaseous acid in a reducing atmosphere at a temperature and for a sufficient duration to decorate and grow the crystal defects to a size capable of being detected as light scattering defects [3]. The etched defects form a shallow structure and their distribution and relative size are inspected by laser light scattering (LLS). However, several groups of defects couldn't be properly sized by the LLS due to the very shallow depth and low

  4. Atomic-scale sharpening of silicon tips in noncontact atomic force microscopy.

    PubMed

    Caciuc, V; Hölscher, H; Blügel, S; Fuchs, H

    2006-01-13

    The atomic-scale stability of clean silicon tips used in noncontact atomic force microscopy (NC-AFM) is simulated by ab initio calculations based on density functional theory. The tip structures are modeled by silicon clusters with and termination. For the often assumed Si(111)-type tip we observe the sharpening of the initially blunt tip via short-range chemical forces during the first approach and retraction cycle. The structural changes corresponding to this intrinsic process are irreversible and lead to stable NC-AFM imaging conditions. In opposition to the picture used in literature, the Si(001)-type tip does not exhibit the so-called "two-dangling bond" feature as a bulklike termination suggests.

  5. Slender tip laser scalpel

    DOEpatents

    Veligdan, James T.

    2004-01-06

    A laser scalpel includes a ribbon optical waveguide extending therethrough and terminating at a slender optical cutting tip. A laser beam is emitted along the height of the cutting tip for cutting tissue therealong.

  6. Healthy Vision Tips

    MedlinePlus

    ... NEI for Kids > Healthy Vision Tips All About Vision About the Eye Ask a Scientist Video Series ... Links to More Information Optical Illusions Printables Healthy Vision Tips Healthy vision starts with you! Use these ...

  7. Computational local stiffness analysis of biological cell: High aspect ratio single wall carbon nanotube tip.

    PubMed

    TermehYousefi, Amin; Bagheri, Samira; Shahnazar, Sheida; Rahman, Md Habibur; Kadri, Nahrizul Adib

    2016-02-01

    Carbon nanotubes (CNTs) are potentially ideal tips for atomic force microscopy (AFM) due to the robust mechanical properties, nanoscale diameter and also their ability to be functionalized by chemical and biological components at the tip ends. This contribution develops the idea of using CNTs as an AFM tip in computational analysis of the biological cells. The proposed software was ABAQUS 6.13 CAE/CEL provided by Dassault Systems, which is a powerful finite element (FE) tool to perform the numerical analysis and visualize the interactions between proposed tip and membrane of the cell. Finite element analysis employed for each section and displacement of the nodes located in the contact area was monitored by using an output database (ODB). Mooney-Rivlin hyperelastic model of the cell allows the simulation to obtain a new method for estimating the stiffness and spring constant of the cell. Stress and strain curve indicates the yield stress point which defines as a vertical stress and plan stress. Spring constant of the cell and the local stiffness was measured as well as the applied force of CNT-AFM tip on the contact area of the cell. This reliable integration of CNT-AFM tip process provides a new class of high performance nanoprobes for single biological cell analysis.

  8. Child Transportation Safety Tips.

    ERIC Educational Resources Information Center

    National Highway Traffic Safety Administration (DOT), Washington, DC.

    This document presents nine tips regarding safe infant and child transportation, each tip explained in one to two pages. The tips are as follows: (1) quick safety seat checkup; (2) where should your child ride? (3) how to protect your new baby in the car; (4) what safety seat to use for a big baby or toddler? (5) how should preschool and school…

  9. Simultaneous topographic and amperometric membrane mapping using an AFM probe integrated biosensor.

    PubMed

    Stanca, Sarmiza Elena; Csaki, Andrea; Urban, Matthias; Nietzsche, Sandor; Biskup, Christoph; Fritzsche, Wolfgang

    2011-02-15

    The investigation of the plasma membrane with intercorrelated multiparameter techniques is a prerequisite for understanding its function. Presented here, is a simultaneous electrochemical and topographic study of the cell membrane using a miniaturized amperometric enzymatic biosensor. The fabrication of this biosensor is also reported. The biosensor combines a scanning force microscopy (AFM) gold-coated cantilever and an enzymatic transducer layer of peroxidases (PODs). When these enzymes are brought in contact with the substrate, the specific redox reaction produces an electric current. The intensity of this current is detected simultaneously with the surface imaging. For sensor characterization, hydroquinone-2-carboxylic acid (HQ) is selected as an intrinsic source of H(2)O(2). HQ has been electrochemically regenerated by the reduction of antraquinone-2-carboxylic acid (AQ). The biosensor reaches the steady state value of the current intensity in 1 ± 0.2s.

  10. A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy.

    PubMed

    Santos, Sergio; Guang, Li; Souier, Tewfik; Gadelrab, Karim; Chiesa, Matteo; Thomson, Neil H

    2012-04-01

    We provide a method to characterize the tip radius of an atomic force microscopy in situ by monitoring the dynamics of the cantilever in ambient conditions. The key concept is that the value of free amplitude for which transitions from the attractive to repulsive force regimes are observed, strongly depends on the curvature of the tip. In practice, the smaller the value of free amplitude required to observe a transition, the sharper the tip. This general behavior is remarkably independent of the properties of the sample and cantilever characteristics and shows the strong dependence of the transitions on the tip radius. The main advantage of this method is rapid in situ characterization. Rapid in situ characterization enables one to continuously monitor the tip size during experiments. Further, we show how to reproducibly shape the tip from a given initial size to any chosen larger size. This approach combined with the in situ tip size monitoring enables quantitative comparison of materials measurements between samples. These methods are set to allow quantitative data acquisition and make direct data comparison readily available in the community.

  11. Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor.

    PubMed

    Stirling, Julian; Shaw, Gordon A

    2013-01-01

    In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

  12. Single stage evaluation of highly loaded high Mach number compressor stages. 6: Data and performance of cantilevered stator

    NASA Technical Reports Server (NTRS)

    Merrow, A. S.

    1972-01-01

    A compressor stage with a rotor tip speed of 1600 ft/sec was tested to evaluate its performance with a cantilevered stator and a rotating inner shroud beneath the stator. Both the rotor blades and the stator vanes were composed of multiple circular arc airfoil sections. Comparison of data taken during this test of the cantilevered stator and previous tests with the same compressor and airfoil geometry in a shroud stator configuration showed only slight differences in stage performance with no significant effect on overall efficiency. However, the severity of the stator wake near the rotating hub was decreased at all flows including the near surge condition. Stall and wise open discharge corrected weight flows were the same as for the shrouded stator configuration.

  13. The co-design of interface sensing and tailoring of ultra-thin film with ultrasonic vibration-assisted AFM system.

    PubMed

    Shi, Jialin; Liu, Lianqing; Li, Guangyong

    2016-06-10

    Ultra-thin films (e.g., graphene, MoS2, and black phosphorus) have shown amazing performance in a variety of applications. The tailoring or machining of these ultra-thin films is often the preliminary step to manufacturing them into functional devices. Atomic force microscopy (AFM) is a flexible, high-efficiency and low-cost tailoring or machining tool with the advantages of high resolution and precision. However, the current AFM-based tailoring methods are often set up as an open loop regarding the machined depth and state. Thus, because of a lack of real-time feedback, an inappropriate applied force leads to over-cutting or under-cutting, which limits the performance of the manufactured devices. In this study, we propose a real-time tailoring and sensing method based on an ultrasonic vibration-assisted (USV-assisted) AFM system to solve the above problems. With the proposed method, the machined depth and state can be sensed in real time by detecting the phase value of the vibrating cantilever. To characterize and gain insight into the phase responses of the cantilever to the machined depth and sample material, a theoretical dynamic model of a cantilever-film vibrating system is introduced to model the machining process, and a sensing theory of machined depth and state is developed based on a USV-assisted AFM system. The experimental results verify the feasibility and effectiveness of the proposed method, which in turn lay the foundation for a closed-loop tailoring control strategy for ultra-thin films.

  14. Real-Time, Label-Free, All-Electrical Detection of Salmonella typhimurium Using Lead Zirconate Titanate/Gold-Coated Glass Cantilevers at any Relative Humidity

    PubMed Central

    Zhu, Qing; Shih, Wan Y.; Shih, Wei-Heng

    2007-01-01

    We have examined non-insulated PZT/gold-coated glass cantilevers for real-time, label-free detection of Salmonella t. by partial dipping at any relative humidity. The PZT/gold-coated glass cantilevers were consisted of a 0.127 mm thick PZT layer about 0.8 mm long, 2 mm wide bonded to a 0.15 mm thick gold-coated glass layer with a 3.0 mm long gold-coated glass tip for detection. We showed that by placing the water level at the nodal point, about 0.8 mm from the free end of the gold-glass tip, there was a 1-hr window in which the resonance frequency was stable despite the water level change by evaporation at 20% relative humidity or higher. By dipping the cantilevers to their nodal point, we were able to do real-time, label-free detection without background resonance frequency corrections at any relative humidity. The partially dipped PZT/gold-coated glass cantilever exhibited mass detection sensitivity, Δm/Δf = −5×10−11g/Hz, and a detection concentration sensitivity, 5×103 cells/ml in 2 ml of liquid, which was about two orders of magnitude lower than that of a 5 MHz QCM. It was also about two orders of magnitude lower than the infection dosage and one order of magnitude lower that the detection limit of a commercial Raptor sensor. PMID:22872784

  15. Hydration states of AFm cement phases

    SciTech Connect

    Baquerizo, Luis G.; Matschei, Thomas; Scrivener, Karen L.; Saeidpour, Mahsa; Wadsö, Lars

    2015-07-15

    The AFm phase, one of the main products formed during the hydration of Portland and calcium aluminate cement based systems, belongs to the layered double hydrate (LDH) family having positively charged layers and water plus charge-balancing anions in the interlayer. It is known that these phases present different hydration states (i.e. varying water content) depending on the relative humidity (RH), temperature and anion type, which might be linked to volume changes (swelling and shrinkage). Unfortunately the stability conditions of these phases are insufficiently reported. This paper presents novel experimental results on the different hydration states of the most important AFm phases: monocarboaluminate, hemicarboaluminate, strätlingite, hydroxy-AFm and monosulfoaluminate, and the thermodynamic properties associated with changes in their water content during absorption/desorption. This data opens the possibility to model the response of cementitious systems during drying and wetting and to engineer systems more resistant to harsh external conditions.

  16. New AFM Techniques for Investigating Molecular Growth Mechanisms of Protein Crystals

    NASA Technical Reports Server (NTRS)

    Li, Huayu; Nadarajah, Arunan; Konnert, John H.; Pusey, Marc L.

    1998-01-01

    Atomic Force Microscopy (AFM) has emerged as a powerful technique for investigating protein crystal growth. Earlier AFM studies were among the first to demonstrate that these crystals grew by dislocation and 2D nucleation growth mechanisms [1]. These investigations were restricted to the micron range where only surface features, such as dislocation hillocks and 2D islands are visible. Most AFM instruments can scan at higher resolutions and have the potential to resolve individual protein molecules at nanometer ranges. Such scans are essential for determining the molecular packing arrangements on crystal faces and for probing the growth process at the molecular level. However, at this resolution the AFM tip influences the image produced, with the resulting image being a convolution of the tip shape and the surface morphology [2]. In most studies this problem is resolved by deconvoluting the image to obtain the true surface morphology. Although deconvolution routines work reasonably well for simple one- dimensional shapes, for complex surfaces this approach does not produce accurate results. In this study we devised a new approach which takes advantage of the precise molecular order of crystal surfaces, combined with the knowledge of individual molecular shapes from the crystallographic data of the protein and the AFM tip shape. This information is used to construct expected theoretical AFM images by convoluting the tip shape with the constructed crystal surface shape for a given surface packing arrangement. By comparing the images from actual AFM scans with the constructed ones for different possible surface packing arrangements, the correct packing arrangement can be conclusively determined. This approach was used in this study to determine the correct one from two possible packing arrangements on (I 10) faces of tetragonal lysozyme crystals. Another novel AFM technique was also devised to measure the dimension of individual growth units of the crystal faces

  17. Arctic climate tipping points.

    PubMed

    Lenton, Timothy M

    2012-02-01

    There is widespread concern that anthropogenic global warming will trigger Arctic climate tipping points. The Arctic has a long history of natural, abrupt climate changes, which together with current observations and model projections, can help us to identify which parts of the Arctic climate system might pass future tipping points. Here the climate tipping points are defined, noting that not all of them involve bifurcations leading to irreversible change. Past abrupt climate changes in the Arctic are briefly reviewed. Then, the current behaviour of a range of Arctic systems is summarised. Looking ahead, a range of potential tipping phenomena are described. This leads to a revised and expanded list of potential Arctic climate tipping elements, whose likelihood is assessed, in terms of how much warming will be required to tip them. Finally, the available responses are considered, especially the prospects for avoiding Arctic climate tipping points.

  18. Note: Mechanical etching of atomic force microscope tip and microsphere attachment for thermal radiation scattering enhancement

    SciTech Connect

    Brissinger, D.; Parent, G. Lacroix, D.

    2013-12-15

    This Note describes a mechanical etching technique which can be used to prepare silicon tips used in atomic force microscopy apparatus. For such devices, dedicated tips with specific shapes are now commonly used to probe surfaces. Yet, the control of the tip morphology where characteristic scales are lower than 1 μm remains a real challenge. Here, we detail a controlled etching process of AFM probes apex allowing micrometer-sized sphere attachment. The technique used and influent parameters are discussed and SEM images of the achieved tips are given. Deceptive problems and drawbacks that might occur during the process are also covered.

  19. Graphene MEMS: AFM probe performance improvement.

    PubMed

    Martin-Olmos, Cristina; Rasool, Haider Imad; Weiller, Bruce H; Gimzewski, James K

    2013-05-28

    We explore the feasibility of growing a continuous layer of graphene in prepatterned substrates, like an engineered silicon wafer, and we apply this as a mold for the fabrication of AFM probes. This fabrication method proves the fabrication of SU-8 devices coated with graphene in a full-wafer parallel technology and with high yield. It also demonstrates that graphene coating enhances the functionality of SU-8 probes, turning them conductive and more resistant to wear. Furthermore, it opens new experimental possibilities such as studying graphene-graphene interaction at the nanoscale with the precision of an AFM or the exploration of properties in nonplanar graphene layers.

  20. Enzymatic nanolithography of FRET peptide layer using V8 protease-immobilized AFM probe.

    PubMed

    Nakamura, Chikashi; Miyamoto, Chie; Obataya, Ikuo; Takeda, Seiji; Yabuta, Masayuki; Miyake, Jun

    2007-04-15

    In our study, a method based on Enzymatic nanolithography was successfully performed in a buffered solution using Staphylococcal serine V8 protease and AFM. To estimate the lithographing activity of the protease immobilized on the AFM tip to peptides immobilized on a substrate, we designed fluorescence resonance energy transfer (FRET) peptides as reporter peptides that showed enzymatic action specific to the V8 protease. When the protease digested the reporter peptide a quencher residue was released from the peptide and resulted in the appearance of fluorescence. In the designed 9-mer peptides, TAMRA functioned as a good quencher for FAM. When the fluorescence resonance energy transfer peptides immobilized on a glass substrate were hydrolyzed by V8 protease at the C-terminal of glutamic acid, fluorescence of a reporter dye was observed because of the release of a quencher from the substrate. After contacting and lateral scanning of the protease-immobilized AFM tip to the reporter peptide layer, a fluorescent area was observed by imaging using total internal refection fluorescence microscopy (TIRFM). The increment of fluorescence intensity of the digested peptide indicates the performance of lithography. Lithographing rates increased in inverse relation to scanning rates of the probe. The maximum limit of the scanning rate, i.e., that was too fast to permit cutting of the peptide on the substrate, and the lithographing performance are discussed in this study.

  1. Implications of the contact radius to line step (CRLS) ratio in AFM for nanotribology measurements.

    PubMed

    Helt, James M; Batteas, James D

    2006-07-04

    Investigating the mechanisms of defect generation and growth at surfaces on the nanometer scale typically requires high-resolution tools such as the atomic force microscope (AFM). To accurately assess the kinetics and activation parameters of defect production over a wide range of loads (F(z)), the AFM data should be properly conditioned. Generally, AFM wear trials are performed over an area defined by the length of the slow (L(sscan)) and fast scan axes. The ratio of L(sscan) to image resolution (res, lines per image) becomes an important experimental parameter in AFM wear trials because it defines the magnitude of the line step (LS = L(sscan)/res), the distance the AFM tip steps along the slow scan axis. Comparing the contact radius (a) to the line step (LS) indicates that the overlap of successive scans will result unless the contact radius-line step ratio (CRLS) is < or =(1)/(2). If this relationship is not considered, then the scan history (e.g., contact frequency) associated with a single scan is not equivalent at different loads owing to the scaling of contact radius with load (a proportional variant F(z)(1/3)). Here, we present a model in conjunction with empirical wear tests on muscovite mica to evaluate the effects of scan overlap on surface wear. Using the Hertz contact mechanics definition of a, the CRLS model shows that scan overlap pervades AFM wear trials even under low loads. Such findings indicate that simply counting the number of scans (N(scans)) in an experiment underestimates the full history conveyed to the surface by the tip and translates into an error in the actual extent to which a region on the surface is contacted. Utilizing the CRLS method described here provides an approach to account for image scan history accurately and to predict the extent of surface wear. This general model also has implications for any AFM measurement where one wishes to correlate scan-dependent history to image properties as well as feature resolution in scanned

  2. 11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    11. VIEW, LOOKING SOUTHEAST, ALONG CENTERLINE FROM SOUTH CANTILEVER TOWARD TOWARD NORTH PORTAL. Note vertical displacement in deck caused by partial collapse at point of connection between south cantilever arm and suspended span. - Smith River Bridge, CA State Highway 199 Spanning Smith River, Crescent City, Del Norte County, CA

  3. Resonating cantilever mass sensor with mechanical on-plane excitation

    NASA Astrophysics Data System (ADS)

    Teva, Jordi; Abadal, Gabriel; Jordà, Xavier; Borrise, Xavier; Davis, Zachary; Barniol, Nuria

    2003-04-01

    The aim of this paper is to report the experimental setup designed, developed and tested in order to achieve the first vibrating mode of a lateral cantilever with mechanical excitation. The on-plane oscillating cantilever is the basis of a proposed mass sensor with an expected resolution in the atto-gram scale. In a first system design, the cantilever is driven electrostatically by an electrode, which is placed parallel to the cantilever. The cantilever is driven to its first resonant mode applying an AC voltage between the cantilever and a driver. Also, a DC voltage is applied to increase the system response. The signal read-out of the transducer is the capacitive current of the cantilever-driver system. The mass sensor proposed, based on this cantilever-driver structure (CDS), is integrated with a CMOS circuitry in order to minimize the parasitic capacitances, that in this case take special relevance because of the low level output current coming from the transducer. Moreover, the electrostatic excitation introduces a parasitic current that overlaps the current due to the resonance. The mechanical excitation is an alternative excitation method which aim is to eliminate the excitation current. Here we describe the experimental facilities developed to achieve mechanical excitation and report preliminary results obtained by this excitation technique. The results are complemented with dynamic simulations of an equivalent system model that are in accordance with the experimental values.

  4. Combined AFM nano-machining and reactive ion etching to fabricate high aspect ratio structures.

    PubMed

    Peng, Ping; Shi, Tielin; Liao, Guanglan; Tang, Zirong

    2010-11-01

    In this paper, a new combined method of sub-micron high aspect ratio structure fabrication is developed which can be used for production of nano imprint template. The process includes atomic force microscope (AFM) scratch nano-machining and reactive ion etching (RIE) fabrication. First, 40 nm aluminum film was deposited on the silicon substrate by magnetron sputtering, and then sub-micron grooves were fabricated on the aluminum film by nano scratch using AFM diamond tip. As aluminum film is a good mask for etching silicon, high aspect ratio structures were finally fabricated by RIE process. The fabricated structures were studied by SEM, which shows that the grooves are about 400 nm in width and 5 microm in depth. To obtain sub-micron scale groove structures on the aluminum film, experiments of nanomachining on aluminum films under various machining conditions were conducted. The depths of the grooves fabricated using different scratch loads were also studied by the AFM. The result shows that the material properties of the film/substrate are elastic-plastic following nearly a bilinear law with isotropic strain hardening. Combined AFM nanomachining and RIE process provides a relative lower cost nano fabrication technique than traditional e-beam lithography, and it has a good prospect in nano imprint template fabrication.

  5. Fracture Mechanics Testing of Titanium 6AL-4V in AF-M315E

    NASA Technical Reports Server (NTRS)

    Sampson, J. W.; Martinez, J.; McLean, C.

    2016-01-01

    The Green Propellant Infusion Mission (GPIM) will demonstrate the performance of AF-M315E monopropellant on orbit. Flight certification requires a safe-life analysis of the titanium alloy fuel tank to ensure inherent processing flaws will not cause failure during the design life of the tank. Material property inputs for this analysis require testing to determine the stress intensity factor for environment-assisted cracking (KEAC) of Ti 6Al-4V in combination with the AF-M315E monopropellant. Testing of single-edge notched, or SE(B), specimens representing the bulk tank membrane and weld material were performed in accordance with ASTM E1681. Specimens with fatigue pre-cracks were loaded into test fixtures so that the crack tips were exposed to AF-M315E at 50 C for a duration of 1,000 hours. Specimens that did not fail during exposure were opened to inspect the crack surfaces for evidence of crack growth. The threshold stress intensity value, KEAC, is the highest applied stress intensity that produced neither a failure of the specimen during the exposure nor showed evidence of crack growth. The threshold stress intensity factor for environment-assisted cracking of the Ti 6Al-4V forged tank material was found to be at least 22 ksivin and at least 31 ksivin for the weld material when exposed to AF-M315E monopropellant.

  6. Study of Silicon Cantilevers by the Photoacoustic Elastic Bending Method

    NASA Astrophysics Data System (ADS)

    Todorovic, D. M.; Rabasovic, M. D.; Markushev, D. D.; Jovic, V.; Radulovic, K. T.

    2017-03-01

    Rectangular silicon cantilevers are studied by the photoacoustic (PA) elastic bending method. Experimental signals versus modulation frequency of the excitation optical beam are measured and analyzed in a frequency range from 20 Hz to 50 000 Hz. The procedure for experimental signal correction to eliminate the frequency characteristics of the measuring system is given. The corrected experimental signal shows a good correlation with theoretically calculated PA signal at frequencies below 32 000 Hz. The corrected experimental PA elastic bending signals for cantilevers with different thicknesses are analyzed. The experimental results allow identifying the resonant frequency (the first resonant mode) of the cantilever vibrations. These values are in good agreement with the theoretically computed values. A theoretical model of the optically excited Si cantilever is derived, taking into account plasmaelastic, thermoelastic, and thermodiffusion mechanisms. Dynamic relations for the amplitude and phase of electronic and thermal elastic vibrations in optically excited cantilevers are derived. The theoretical model is compared to the experimental results.

  7. Conductance of AFM Deformed Carbon Nanotubes

    NASA Technical Reports Server (NTRS)

    Svizhenko, Alexei; Maiti, Amitesh; Anatram, M. P.; Biegel, Bryan (Technical Monitor)

    2002-01-01

    This viewgraph presentation provides information on the electrical conductivity of carbon nanotubes upon deformation by atomic force microscopy (AFM). The density of states and conductance were computed using four orbital tight-binding method with various parameterizations. Different chiralities develop bandgap that varies with chirality.

  8. Contact nanomechanical measurements with the AFM

    NASA Astrophysics Data System (ADS)

    Geisse, Nicholas

    2013-03-01

    The atomic force microscope (AFM) has found broad use in the biological sciences largely due to its ability to make measurements on unfixed and unstained samples under liquid. In addition to imaging at multiple spatial scales ranging from micro- to nanometer, AFMs are commonly used as nanomechanical probes. This is pertinent for cell biology, as it has been demonstrated that the geometrical and mechanical properties of the extracellular microenvironment are important in such processes as cancer, cardiovascular disease, muscular dystrophy, and even the control of cell life and death. Indeed, the ability to control and quantify these external geometrical and mechanical parameters arises as a key issue in the field. Because AFM can quantitatively measure the mechanical properties of various biological samples, novel insights to cell function and to cell-substrate interactions are now possible. As the application of AFM to these types of problems is widened, it is important to understand the performance envelope of the technique and its associated data analyses. This talk will discuss the important issues that must be considered when mechanical models are applied to real-world data. Examples of the effect of different model assumptions on our understanding of the measured material properties will be shown. Furthermore, specific examples of the importance of mechanical stimuli and the micromechanical environment to the structure and function of biological materials will be presented.

  9. Orthodontic Traction of Impacted Canine Using Cantilever

    PubMed Central

    Gonçalves, João Roberto; Cassano, Daniel Serra; Bianchi, Jonas

    2016-01-01

    The impaction of the maxillary canines causes relevant aesthetic and functional problems. The multidisciplinary approach to the proper planning and execution of orthodontic traction of the element in question is essential. Many strategies are cited in the literature; among them is the good biomechanical control in order to avoid possible side effects. The aim of this paper is to present a case report in which a superior canine impacted by palatine was pulled out with the aid of the cantilever on the Segmented Arch Technique (SAT) concept. A 14.7-year-old female patient appeared at clinic complaining about the absence of the upper right permanent canine. The proposed treatment prioritized the traction of the upper right canine without changing the occlusion and aesthetics. For this, it only installed the upper fixed appliance (Roth with slot 0.018), opting for SAT in order to minimize unwanted side effects. The use of cantilever to the traction of the upper right canine has enabled an efficient and predictable outcome, because it is of statically determined mechanics. PMID:27800192

  10. Optical racetrack resonator transduction of nanomechanical cantilevers.

    PubMed

    Sauer, V T K; Diao, Z; Freeman, M R; Hiebert, W K

    2014-02-07

    Optomechanical transduction has demonstrated its supremacy in probing nanomechanical displacements. In order to apply nano-optomechanical systems (NOMS) as force and mass sensors, knowledge about the transduction responsivity (i.e. the change in measured optical transmission with nanomechanical displacement) and its tradeoffs with system design is paramount. We compare the measured responsivities of NOMS devices with varying length, optomechanical coupling strength gom, and optical cavity properties. Cantilever beams 1.5 to 5 μm long are fabricated 70 to 160 nm from a racetrack resonator optical cavity and their thermomechanical (TM) noise signals are measured. We derive a generic expression for the transduction responsivity of the NOMS in terms of optical and mechanical system parameters such as finesse, optomechanical coupling constant, and interaction length. The form of the expression holds direct insight as to how these parameters affect the responsivity. With this expression, we obtain the optomechanical coupling constants using only measurements of the TM noise power spectra and optical cavity transmission slopes. All optical pump/probe operation is also demonstrated in our side-coupled cantilever-racetrack NOMS. Finally, to assess potential operation in a gas sensing environment, the TM noise signal of a device is measured at atmospheric pressure.

  11. Helicopter blade tips

    NASA Technical Reports Server (NTRS)

    Lyothier, R.

    1983-01-01

    Methods of improving helicopter performance and vibration level by proper shaping of helicopter blade tips are considered. The principle involved consists of reducing the extent of the supersonic zone above the advancing tip and of the turbulent interaction. For stationary and advancing flight, the influence of the rotor and the problems posed by blade tips are reviewed. The theoretical methods of dealing with the two types of flight are briefly stated, and the experimental apparatus is described, including model triple and quadruple rotors. Different blade tip shapes are shown and briefly discussed. The theoretical results include an advancing speed of 309 km/H and a blade tip rotational speed of 215 m/s. The experimental values are advancing speed of 302 km/h and blade tip Mach number 0.86 for both types of rotors.

  12. High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.

    PubMed

    Onishi, Keiko; Guo, Hongxuan; Nagano, Syoko; Fujita, Daisuke

    2014-11-01

    A Scanning Helium Ion Microscope (SHIM) is a high resolution surface observation instrument similar to a Scanning Electron Microscope (SEM) since both instruments employ finely focused particle beams of ions or electrons [1]. The apparent difference is that SHIMs can be used not only for a sub-nanometer scale resolution microscopic research, but also for the applications of very fine fabrication and direct lithography of surfaces at the nanoscale dimensions. On the other hand, atomic force microscope (AFM) is another type of high resolution microscopy which can measure a three-dimensional surface morphology by tracing a fine probe with a sharp tip apex on a specimen's surface.In order to measure highly uneven and concavo-convex surfaces by AFM, the probe of a high aspect ratio with a sharp tip is much more necessary than the probe of a general quadrangular pyramid shape. In this paper we report the manufacture of the probe tip of the high aspect ratio by ion-beam induced gas deposition using a nanoscale helium ion beam of SHIM.Gas of platinum organic compound was injected into the sample surface neighborhood in the vacuum chamber of SHIM. The decomposition of the gas and the precipitation of the involved metal brought up a platinum nano-object in a pillar shape on the normal commercial AFM probe tip. A SHIM system (Carl Zeiss, Orion Plus) equipped with the gas injection system (OmniProbe, OmniGIS) was used for the research. While the vacuum being kept to work, we injected platinum organic compound ((CH3)3(CH3C5H4)Pt) into the sample neighborhood and irradiated the helium ion beam with the shape of a point on the apex of the AFM probe tip. It is found that we can control the length of the Pt nano-pillar by irradiation time of the helium ion beam. The AFM probe which brought up a Pt nano-pillar is shown in Figure 1. It is revealed that a high-aspect-ratio Pt nano-pillar of ∼40nm diameter and up to ∼2000 nm length can be grown. In addition, for possible heating

  13. Comparison of the Identation and Elasticity of E.coli and its Spheroplasts by AFM

    SciTech Connect

    Sullivan, Claretta J; Venkataraman, Sankar; Retterer, Scott T; Allison, David P; Doktycz, Mitchel John

    2007-01-01

    Atomic force microscopy (AFM) provides a unique opportunity to study live individual bacteria at the nanometer scale. In addition to providing accurate morphological information, AFM can be exploited to investigate membrane protein localization and molecular interactions on the surface of living cells. A prerequisite for these studies is the development of robust procedures for sample preparation. While such procedures are established for intact bacteria, they are only beginning to emerge for bacterial spheroplasts. Spheroplasts are useful research models for studying mechanosensitive ion channels, membrane transport, lipopolysaccharide translocation, solute uptake, and the effects of antimicrobial agents on membranes. Furthermore, given the similarities between spheroplasts and cell wall-deficient (CWD) forms of pathogenic bacteria, spheroplast research could be relevant in biomedical research. In this paper, a new technique for immobilizing spheroplasts on mica pretreated with aminopropyltriethoxysilane (APTES) and glutaraldehyde is described. Using this mounting technique, the indentation and cell elasticity of glutaraldehyde-fixed and untreated spheroplasts of E. coli in liquid were measured. These values are compared to those of intact E. coli. Untreated spheroplasts were found to be much softer than the intact cells and the silicon nitride cantilevers used in this study.

  14. Investigation of geometrical effects in the carbon allotropes manipulation based on AFM: multiscale approach

    NASA Astrophysics Data System (ADS)

    Korayem, M. H.; Hefzabad, R. N.; Homayooni, A.; Aslani, H.

    2017-01-01

    Carbon allotropes are used as nanocarriers for drug and cell delivery. To obtain an accurate result in the nanoscale, it is important to use a precise model. In this paper, a multiscale approach is presented to investigate the manipulation process of carbon allotropes based on atomic force microscopy (AFM). For this purpose, the AFM setup is separated into two parts with different sizes as macro field (MF) and nano field (NF). Using Kirchhoff's plate model, the cantilever (the main part of MF) is modeled. The molecular dynamics method is applied to model the NF part, and then the MF and NF are coupled with the multiscale algorithm. With this model, by considering the effect of size and shape, the manipulation of carbon allotropes is carried out. The manipulations of armchair CNTs and fullerenes are performed to study the diameter changing effects. The result shows that the manipulation and friction force increases by increasing the diameter. The result of the indentation depth for the armchair CNTs indicates that decreasing the diameter causes the indentation depth to reduce. Moreover, the manipulations of four kinds of carbon allotropes with the same number of atoms have been studied to investigate the geometrical effects. The shapes of these nanoparticles change from sphere to cylinder. The results illustrate that the manipulation and the friction force decrease as the nanoparticle shape varies from sphere to cylinder. The Von-Mises results demonstrate that by changing the nanoparticle shape from the spherical to the cylindrical form, the stress increases, although the manipulation force reduces.

  15. Adaptive AFM scan speed control for high aspect ratio fast structure tracking

    SciTech Connect

    Ahmad, Ahmad; Schuh, Andreas; Rangelow, Ivo W.

    2014-10-15

    Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is necessary to cover a large surface under investigation in reasonable times. Since AFMs are composed of mechanical components, they are associated with comparably low resonance frequencies that undermine the effort to increase the acquisition rates. In particular, high and steep structures are difficult to follow, which causes the cantilever to temporarily loose contact to or crash into the sample. Here, we report on a novel approach that does not affect the scanner dynamics, but adapts the lateral scanning speed of the scanner. The controller monitors the control error signal and, only when necessary, decreases the scan speed to allow the z-piezo more time to react to changes in the sample's topography. In this case, the overall imaging rate can be significantly increased, because a general scan speed trade-off decision is not needed and smooth areas are scanned fast. In contrast to methods trying to increase the z-piezo bandwidth, our method is a comparably simple approach that can be easily adapted to standard systems.

  16. Simulation of Tip-Sample Interaction in the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    Good, Brian S.; Banerjea, Amitava

    1994-01-01

    Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.

  17. An elastography method based on the scanning contact resonance of a piezoelectric cantilever

    SciTech Connect

    Fu, Ji; Li, Faxin

    2013-12-15

    Purpose: Most tissues may become significantly stiffer than their normal states when there are lesions inside. The tissue's modulus can then act as an identification parameter for clinic diagnosis of tumors or fibrosis, which leads to elastography. This study introduces a novel elastography method that can be used for modulus imaging of superficial organs. Methods: This method is based on the scanning contact-resonance of a unimorph piezoelectric cantilever. The cantilever vibrates in its bending mode with the tip pressed tightly on the sample. The contact resonance frequency of the cantilever-sample system is tracked at each scanning point, from which the sample's modulus can be derived based on a beam dynamic model and a contact mechanics model. Scanning is performed by a three-dimensional motorized stage and the whole system is controlled by a homemade software program based on LabVIEW. Results: Testing onin vitro beef tissues indicates that the fat and the muscle can be easily distinguished using this system, and the accuracy of the modulus measurement can be comparable with that of nanoindentation. Imaging on homemade gelatin phantoms shows that the depth information of the abnormalities can be qualitatively obtained by varying the pressing force. The detection limit of this elastography method is specially examined both experimentally and numerically. Results show that it can detect the typical lesions in superficial organs with the depth of several centimeters. The lateral resolution of this elastography method/system is better than 0.5 mm, and could be further enhanced by using more scanning points. Conclusions: The proposed elastography system can be regarded as a sensitive palpation robot, which may be very promising in early diagnosis of tumors in superficial organs such as breast and thyroid.

  18. Molecular dynamics study on the mechanism of AFM-based nanoscratching process with water-layer lubrication

    NASA Astrophysics Data System (ADS)

    Ren, Jiaqi; Zhao, Jinsheng; Dong, Zeguang; Liu, Pinkuan

    2015-08-01

    The atomic force microscopy (AFM) based direct nanoscratching has been thoroughly studied but the mechanism of nanoscratching with water-layer lubrication is yet to be well understood. In current study, three-dimensional molecular dynamics (MD) simulations are conducted to evaluate the effects of the water-layer lubrication on the AFM-based nanoscratching process on monocrystalline copper. Comparisons of workpiece deformation, scratching forces, and friction coefficients are made between the water-lubricated and dry scratching under various thickness of water layer, scratching depth and scratching velocity. Simulation results reveal that the water layer has positive impact on the surface quality and significant influence on the scratching forces (normal forces and tangential forces). The friction coefficients of the tip in water-lubricated nanoscratching are significantly bigger than those in the dry process. Our simulation results shed lights on a promising AFM-based nanofabrication method, which can assist to get nanoscale surface morphologies with higher quality than traditional approaches.

  19. Understanding the TERS Effect with On-line Tunneling and Force Feedback Using Multiprobe AFM/NSOM with Raman Integration

    NASA Astrophysics Data System (ADS)

    Lewis, Aaron; Dekhter, Rimma; Hamra, Patricia; Bar-David, Yossi; Taha, Hesham

    Tip enhanced Raman scattering (TERS) has evolved in several directions over the past years. The data from this variety of methodologies has now accumulated to the point that there is a reasonable possibility of evolving an understanding of the underlying cause of the resulting effects that could be the origin of the various TERS enhancement processes. The objective of this presentation is to use the results thus far with atomic force microscopy (AFM) probes with noble metal coating, etching, transparent gold nanoparticles with and without a second nanoparticle [Wang and Schultz, ANALYST 138, 3150 (2013)] and tunneling feedback probes [R. Zhang et. al., NATURE 4 9 8, 8 2 (2013)]. We attempt at understanding this complex of results with AFM/NSOM multiprobe techniques. Results indicate that TERS is dominated by complex quantum interactions. This produces a highly confined and broadband plasmon field with all k vectors for effective excitation. Normal force tuning fork feedback with exposed tip probes provides an excellent means to investigate these effects with TERS probes that we have shown can circumvent the vexing problem of jump to contact prevalent in conventional AFM methodology and permit on-line switching between tunneling and AFM feedback modes of operation.

  20. Cantilevered multilevel LIGA devices and methods

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.

    2002-01-01

    In the formation of multilevel LIGA microstructures, a preformed sheet of photoresist material, such as polymethylmethacrylate (PMMA) is patterned by exposure through a mask to radiation, such as X-rays, and developed using a developer to remove the exposed photoresist material. A first microstructure is then formed by electroplating metal into the areas from which the photoresist has been removed. Additional levels of microstructure are added to the initial microstructure by covering the first microstructure with a conductive polymer, machining the conductive polymer layer to reveal the surface of the first microstructure, sealing the conductive polymer and surface of the first microstructure with a metal layer, and then forming the second level of structure on top of the first level structure. In such a manner, multiple layers of microstructure can be built up to allow complex cantilevered microstructures to be formed.

  1. Forced vibrations of a cantilever beam

    NASA Astrophysics Data System (ADS)

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-09-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is ‘downwards’, i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping resonance response are compared for the case of an elastic beam made from PVC plastic excited over a frequency range from 1 to 30 Hz. The current analysis predicts the presence of ‘pseudo-nodes’ in the normal modes of oscillation. It is important to note that our results were obtained using very simple equipment, present in the teaching laboratory.

  2. Hot Weather Tips

    MedlinePlus

    ... FCA - A A + A You are here Home HOT Weather Tips Printer-friendly version We all suffer in hot weather. However, for elderly and disabled people and ... stress and following these tips for dealing with hot weather. Wear cool clothing: See that the person ...

  3. Total Telephone Tips.

    ERIC Educational Resources Information Center

    Corder, Lloyd E.; And Others

    This manual of telephone behavior tips for business and sales professionals offers ways to handle the disgruntled caller and makes suggestions on topics relevant to the telephone. The manual is divided into the following sections and subsections: (1) Common Courtesy (staff tips, answering the telephone, screening calls, transferring calls, taking…

  4. Detection of Pathogens Using AFM and SPR

    NASA Astrophysics Data System (ADS)

    Vaseashta, Ashok

    2005-03-01

    A priori detection of pathogens in food and water has become a subject of paramount importance. Several recent incidents have resulted in the government passing stringent regulations for tolerable amounts of contamination of food products. Identification and/or monitoring of bacterial contamination in food are critical. The conventional methods of pathogen detection require time-consuming steps to arrive disembark at meaningful measurement in a timely manner as the detection time exceeds the time in which perishable food recycles through the food chain distribution. The aim of this presentation is to outline surface plasmon resonance (SPR) and atomic force microscopy (AFM) as two methods for fast detect6ion of pathogens. Theoretical basis of SPR and experimental results of SPR and AFM on E. coli O157:H7 and prion are presented.

  5. Continuously tunable terahertz metamaterial employing magnetically actuated cantilevers.

    PubMed

    Ozbey, Burak; Aktas, Ozgur

    2011-03-28

    Terahertz metamaterial structures that employ flexing microelectromechanical cantilevers for tuning the resonance frequency of an electric split-ring resonator are presented. The tuning cantilevers are coated with a magnetic thin-film and are actuated by an external magnetic field. The use of cantilevers enables continuous tuning of the resonance frequency over a large frequency range. The use of an externally applied magnetic field for actuation simplifies the metamaterial structure and its use for sensor or filter applications. A structure for minimizing the actuating field is derived. The dependence of the tunable bandwidth on frequency is discussed.

  6. Characterization of magnetically actuated resonant cantilevers in viscous fluids

    NASA Astrophysics Data System (ADS)

    Vančura, Cyril; Lichtenberg, Jan; Hierlemann, Andreas; Josse, Fabien

    2005-10-01

    The vibration behavior of magnetically actuated resonant microcantilevers immersed in viscous fluids has been studied. A dependence of the resonance frequency and the quality factor (Q factor) on the fluid properties, such as density and viscosity and on the cantilever geometry is described. Various cantilever geometries are analyzed in pure water and glycerol solutions, and the results are explained in terms of the added displaced fluid mass and the fluid damping force for both the resonance frequency and the quality factor. An in-depth knowledge and understanding of such systems is necessary when analyzing resonant cantilevers as biochemical sensors in liquid environments.

  7. Piezoresistive cantilever array sensor for consolidated bioprocess monitoring

    SciTech Connect

    Kim, Seonghwan Sam; Rahman, Touhidur; Senesac, Larry R; Davison, Brian H; Thundat, Thomas George

    2009-01-01

    Cellulolytic microbes occur in diverse natural niches and are being screened for industrial modification and utility. A microbe for Consolidated bioprocessing (CBP) development can rapidly degrade pure cellulose and then ferment the resulting sugars into fuels. To identify and screen for novel microbes for CBP, we have developed a piezoresistive cantilever array sensor which is capable of simultaneous monitoring of glucose and ethanol concentration changes in a phosphate buffer solution. 4-mercaptophenylboronic acid (4-MPBA) and polyethyleneglycol (PEG)-thiol are employed to functionalize each piezoresistive cantilever for glucose and ethanol sensing, respectively. Successful concentration measurements of glucose and ethanol with minimal interferences are obtained with our cantilever array sensor.

  8. AFM studies of the crystallization and habit modification of an excipient material, adipic acid.

    PubMed

    Keel, T R; Thompson, C; Davies, M C; Tendler, S J B; Roberts, C J

    2004-08-06

    Atomic force microscopy (AFM) has been used to investigate the (1 0 0) face of crystalline adipic acid, both in air and liquid environments. In air, surface reorganization occurred during scanning of the AFM probe, which has been investigated using single point force-distance analysis under a controlled relative humidity (RH) environment. We suggest such reorganization can be attributed to the influence of a network of water molecules bound to the hydrophilic (1 0 0) surface permitting local AFM tip-enhanced dissolution and reorganization of the solute. In situ imaging was also carried out on the crystals, revealing etch-pit formation during dissolution, and rapid growth at higher levels of supersaturation (sigma), both of which are direct consequences of the hydrophilic nature of the (1 0 0) face. Also presented here are nanoscale observations of the effect of octanoic acid, a structurally-related habit modifier, on crystalline adipic acid. Using AFM, we have been able to show that the presence of octanoic acid at low concentration has little observable affect on the development of the (1 0 0) face; however, as this concentration is increased, there are clear changes in step morphology and growth mode on the (1 0 0) face of the crystal. At a concentration of 1.26 mmol dm(-3) (a concentration corresponding to a molar ratio of approximately 1:175 octanoic acid:adipic acid), growth on the (1 0 0) face is inhibited, with in situ AFM imaging indicating this is a direct consequence of octanoic acid binding to the surface, and pinning the monomolecular growth steps.

  9. Multifunctional cantilever-free scanning probe arrays coated with multilayer graphene

    PubMed Central

    Shim, Wooyoung; Brown, Keith A.; Zhou, Xiaozhu; Rasin, Boris; Liao, Xing; Mirkin, Chad A.

    2012-01-01

    Scanning probe instruments have expanded beyond their traditional role as imaging or “reading” tools and are now routinely used for “writing.” Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning probe lithography technique to become widely applied, there needs to be a reasonable path toward a scalable architecture. Here, we use a multilayer graphene coating method to create multifunctional massively parallel probe arrays that have wear-resistant tips of uncompromised sharpness and high electrical and thermal conductivities. The optical transparency and mechanical flexibility of graphene allow this procedure to be used for coating exceptionally large, cantilever-free arrays that can pattern with electrochemical desorption and thermal, in addition to conventional, dip-pen nanolithography. PMID:23086161

  10. Vibration signature analysis of AFM images

    SciTech Connect

    Joshi, G.A.; Fu, J.; Pandit, S.M.

    1995-12-31

    Vibration signature analysis has been commonly used for the machine condition monitoring and the control of errors. However, it has been rarely employed for the analysis of the precision instruments such as an atomic force microscope (AFM). In this work, an AFM was used to collect vibration data from a sample positioning stage under different suspension and support conditions. Certain structural characteristics of the sample positioning stage show up as a result of the vibration signature analysis of the surface height images measured using an AFM. It is important to understand these vibration characteristics in order to reduce vibrational uncertainty, improve the damping and structural design, and to eliminate the imaging imperfections. The choice of method applied for vibration analysis may affect the results. Two methods, the data dependent systems (DDS) analysis and the Welch`s periodogram averaging method were investigated for application to this problem. Both techniques provide smooth spectrum plots from the data. Welch`s periodogram provides a coarse resolution as limited by the number of samples and requires a choice of window to be decided subjectively by the user. The DDS analysis provides sharper spectral peaks at a much higher resolution and a much lower noise floor. A decomposition of the signal variance in terms of the frequencies is provided as well. The technique is based on an objective model adequacy criterion.

  11. Effects of self-assembled monolayer and PFPE lubricant on wear characteristics of flat silicon tips.

    SciTech Connect

    Kim, H. J.; Jang, C. E.; Kim, D. E.; Kim, Y. K.; Choa, S. H.; Hong, S.; Materials Science Division; Yonsei Univ.; Samsung Adv. Inst. Science and Technology; Seoul National Univ. of Technology

    2009-01-01

    The effects of self-assembled monolayer (SAM) and perfluoropolyether (PFPE) lubricant on the wear characteristics of flat silicon tips were investigated. The wear test consisted of sliding the silicon tips fabricated on a flat silicon specimen against SAM and PFPE (Z-tetraol) coated silicon (100) wafer. The tips were slid at a low speed for about 15 km under an applied load of 39.2 {micro}N. The wear volume of the tip was obtained by measuring the tip profile using an Atomic Force Microscope (AFM). It was found that the coatings were effective in reducing the wear of the tips by an order of magnitude from 10{sup -6} to 10{sup -7}.

  12. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip.

    PubMed

    Gururajan, Giriprasath; Sullivan, S P; Beebe, T P; Chase, D B; Rabolt, J F

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  13. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Gururajan, Giriprasath; Sullivan, S. P.; Beebe, T. P.; Chase, D. B.; Rabolt, J. F.

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  14. Single Cell Wall Nonlinear Mechanics Revealed by a Multiscale Analysis of AFM Force-Indentation Curves.

    PubMed

    Digiuni, Simona; Berne-Dedieu, Annik; Martinez-Torres, Cristina; Szecsi, Judit; Bendahmane, Mohammed; Arneodo, Alain; Argoul, Françoise

    2015-05-05

    Individual plant cells are rather complex mechanical objects. Despite the fact that their wall mechanical strength may be weakened by comparison with their original tissue template, they nevertheless retain some generic properties of the mother tissue, namely the viscoelasticity and the shape of their walls, which are driven by their internal hydrostatic turgor pressure. This viscoelastic behavior, which affects the power-law response of these cells when indented by an atomic force cantilever with a pyramidal tip, is also very sensitive to the culture media. To our knowledge, we develop here an original analyzing method, based on a multiscale decomposition of force-indentation curves, that reveals and quantifies for the first time the nonlinearity of the mechanical response of living single plant cells upon mechanical deformation. Further comparing the nonlinear strain responses of these isolated cells in three different media, we reveal an alteration of their linear bending elastic regime in both hyper- and hypotonic conditions.

  15. Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM

    PubMed Central

    Castanié, Fabien; Nony, Laurent; Gauthier, Sébastien

    2012-01-01

    Summary Background: Characterization at the atomic scale is becoming an achievable task for FM-AFM users equipped, for example, with a qPlus sensor. Nevertheless, calculations are necessary to fully interpret experimental images in some specific cases. In this context, we developed a numerical AFM (n-AFM) able to be used in different modes and under different usage conditions. Results: Here, we tackled FM-AFM image calculations of three types of graphitic structures, namely a graphite surface, a graphene sheet on a silicon carbide substrate with a Si-terminated surface, and finally, a graphene nanoribbon. We compared static structures, meaning that all the tip and sample atoms are kept frozen in their equilibrium position, with dynamic systems, obtained with a molecular dynamics module allowing all the atoms to move freely during the probe oscillations. Conclusion: We found a very good agreement with experimental graphite and graphene images. The imaging process for the deposited nanoribbon demonstrates the stability of our n-AFM to image a non-perfectly planar substrate exhibiting a geometrical step as well as a material step. PMID:22497004

  16. DETAIL OF CANTILEVERED MEZZANINE OBSERVATION ROOM ON SOUTH WEST CORNER ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    DETAIL OF CANTILEVERED MEZZANINE OBSERVATION ROOM ON SOUTH- WEST CORNER OF BUILDING. VIEW TO NORTHEAST. - Plattsburgh Air Force Base, Base Engineer Pavement & Grounds Facility, Off Colorado Street, Plattsburgh, Clinton County, NY

  17. 258. Dennis Hill, Photographer April 1998 VIEW OF CANTILEVER TRUSS ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    258. Dennis Hill, Photographer April 1998 VIEW OF CANTILEVER TRUSS ANCHOR ARM AT PIERS E- AND E-2, SOUTH SIDE, FACING NORTH. - San Francisco Oakland Bay Bridge, Spanning San Francisco Bay, San Francisco, San Francisco County, CA

  18. View from underneath bridge on west side shows cantilevered steel ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    View from underneath bridge on west side shows cantilevered steel supports for sidewalk above. - Raging River Bridge No. 234A, Preston-Fall City Road & Southeast Forty-fourth Place, Fall City, King County, WA

  19. Superstructure Main Bridge, Cross Sections, Cantilever Structure Huey ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    Superstructure - Main Bridge, Cross Sections, Cantilever Structure - Huey P. Long Bridge, Spanning Mississippi River approximately midway between nine & twelve mile points upstream from & west of New Orleans, Jefferson, Jefferson Parish, LA

  20. 14. DETAIL VIEW OF THE CANTILEVER & 'S' BRACKETS AND ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    14. DETAIL VIEW OF THE CANTILEVER & 'S' BRACKETS AND THE SOUTH HANDRAIL, PANEL 1, NEAR THE SOUTHEAST ABUTMENT, LOOKING NORTHWEST Harms - Benton Street Bridge, Spanning Iowa River at Benton Street, Iowa City, Johnson County, IA

  1. 20. DETAIL OF WEST ANCHOR SPAN, CANTILEVER ARMS AND WEST ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    20. DETAIL OF WEST ANCHOR SPAN, CANTILEVER ARMS AND WEST HALF OF SUSPENDED SPAN OF THROUGH TRUSS. VIEW TO NORTHEAST. - MacArthur Bridge, Spanning Mississippi River on Highway 34 between IA & IL, Burlington, Des Moines County, IA

  2. 29. DECK / WEB / LATERAL BRACING DETAIL OF CANTILEVER ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    29. DECK / WEB / LATERAL BRACING DETAIL OF CANTILEVER ARM OF THROUGH TRUSS. VIEW TO WEST. - MacArthur Bridge, Spanning Mississippi River on Highway 34 between IA & IL, Burlington, Des Moines County, IA

  3. Thermo-mechanical analysis of FG nanobeam with attached tip mass: an exact solution

    NASA Astrophysics Data System (ADS)

    Ghadiri, Majid; Jafari, Ali

    2016-12-01

    Present disquisition proposes an analytical solution method for exploring the vibration characteristics of a cantilever functionally graded nanobeam with a concentrated mass exposed to thermal loading for the first time. Thermo-mechanical properties of FGM nanobeam are supposed to change through the thickness direction of beam based on the rule of power-law (P-FGM). The small-scale effect is taken into consideration based on nonlocal elasticity theory of Eringen. Linear temperature rise (LTR) through thickness direction is studied. Existence of centralized mass in the free end of nanobeam influences the mechanical and physical properties. Timoshenko beam theory is employed to derive the nonlocal governing equations and boundary conditions of FGM beam attached with a tip mass under temperature field via Hamilton's principle. An exact solution procedure is exploited to achieve the non-dimensional frequency of FG nanobeam exposed to temperature field with a tip mass. A parametric study is led to assess the efficacy of temperature changes, tip mass, small scale, beam thickness, power-law exponent, slenderness and thermal loading on the natural frequencies of FG cantilever nanobeam with a point mass at the free end. It is concluded that these parameters play remarkable roles on the dynamic behavior of FG nanobeam subjected to LTR with a tip mass. The results for simpler states are confirmed with known data in the literature. Presented numerical results can serve as benchmarks for future thermo-mechanical analyses of FG nanobeam with tip mass.

  4. Harmonic detection of resonance in micro- and nano-cantilevers

    NASA Astrophysics Data System (ADS)

    Gaillard, Jay B.

    Over the past decade there has been an explosion in the study of cantilevered beams on the micron and submicron dimension. The applications and research that involve these structures include state-of-the-art electronic components, sensors, and more recently, studies aimed at elucidating the mechanical properties of cantilevered carbon nanotubes and semiconducting nanowires. In nanoelectro-mechanical systems (NEMS), it is desirable to develop a capacitive readout method involving only two electrodes that are fully compliant with standard CMOS technology. However, the main drawback with this method is the ability to detect resonance in the presence of parasitic capacitance, which is due to the fringing electric fields present between the electrodes (cantilever and the counter electrode). The work presented in this thesis deals with the electrical actuation/detection of mechanical resonance in individual micron and sub-micron sized cantilevers. The aim is to overcome parasitic capacitance which masks the detection of resonance signal in these cantilevers thereby increasing the signal-to-background ratio (SBR). In our method, a silicon microcantilever, or cantilevered multi-walled carbon nanotube (MWNT), is placed close to a counter electrode whose potential is varied at a frequency o. An electrical signal comes from the flow of charge on and off of the cantilever when o equals a resonant frequency o 0 of the cantilever. Higher harmonics of o0 are measured to overcome the parasitic capacitance. This technique, termed harmonic detection of resonance (HDR), allows detection at frequencies well removed from the driving frequency thereby increasing the SBR by ~3 orders of magnitude. It is shown that HDR allows the detection of resonance even in multi-walled carbon nanotubes, which have diameters on the order of 50 nm. Furthermore, superharmonics inherent to electrostatic actuation, are shown to occur at driving frequencies of o0/n where n = 1,2,3,....

  5. On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography.

    PubMed

    Gregusová, D; Martaus, J; Fedor, J; Kúdela, R; Kostic, I; Cambel, V

    2009-07-01

    We developed a technology of sub-micrometer Hall probes for future application in scanning hall probe microscopy (SHPM) and magnetic force microscopy (MFM). First, the Hall probes of approximately 9-mum dimensions are prepared on the top of high-aspect-ratio GaAs pyramids with an InGaP/AlGaAs/GaAs active layer using wet-chemical etching and non-planar lithography. Then we show that the active area of planar Hall probes can be downsized to sub-micrometer dimensions by local anodic oxidation technique using an atomic force microscope. Such planar probes are tested and their noise and magnetic field sensitivity are evaluated. Finally, the two technologies are combined to fabricate sub-micrometer Hall probes on the top of high-aspect ratio mesa for future SHPM and MFM techniques.

  6. Spatially highly resolved study of AFM scanning tip quantum dot local interaction

    NASA Astrophysics Data System (ADS)

    Kicin, S.; Pioda, A.; Ihn, T.; Sigrist, M.; Fuhrer, A.; Ensslin, K.; Reinwald, M.; Wegscheider, W.

    2005-08-01

    Scanning-gate imaging of semiconductor quantum dots (QDs) promises access to probability distributions of quantum states. It could therefore be a novel tool for designing and optimizing tailored quantum states in such systems. A detailed study of a lithographically defined semiconductor QD in the Coulomb-blockade regime is presented, making use of the scanning-gate technique at a base temperature of 300 mK. The method allows a one-by-one manipulation of electrons in the structure. The obtained images interpreted with a suitable QD model guide the way to a local investigation of the electronic interior of the QD. Future perspectives of scanning-gate experiments on QDs are discussed.

  7. Bed Bug Tips

    EPA Pesticide Factsheets

    How to deal with bed bugs in one printable page. Ten tips include ensuring correct insect identification, reducing clutter, understand integrated pest management, using mattress and box spring encasements, and heat treatment.

  8. Tips for labor coaches

    MedlinePlus

    ... some tips for getting prepared. Before the big day Arrives Labor coaches should go to childbirth classes ... get through her labor and delivery. When the day Arrives You might be at the hospital for ...

  9. Insider conference tips

    NASA Astrophysics Data System (ADS)

    Tennant, Jill

    2012-01-01

    Attending an educator conference and its associated exhibit hall can be a rewarding experience for your brain. But if you keep in mind these insider's tips, your feet, arms, stomach, and wallet will also thank you.

  10. Tips from the Classroom.

    ERIC Educational Resources Information Center

    Epstein, Jim; Ashcraft, Nikki; Clarke, Paul M.; Wolf, Grant S.

    1999-01-01

    Four tips for use in the English-as-a-Second-Language classroom are highlighted: Mr. Bean in the Classroom; Defining Your Future; Coin Questions; Our Futures: Simple, Progressive, and Perfect. (Author/VWL)

  11. Tips for Chronic Pain

    MedlinePlus

    Patient Education Sheet Tips for Chronic Pain The SSF thanks Stuart S. Kassan, MD, FACP, Clinical Professor of Medicine, University of Colorado Health Sciences Center, Denver, Colorado, for authoring ...

  12. Eye Drop Tips

    MedlinePlus

    ... Involved News About Us Donate In This Section Eye Drop Tips en Español email Send this article ... the reach of children. Steps For Putting In Eye Drops: Start by tilting your head backward while ...

  13. BOREAS AFM-6 Surface Meteorological Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) collected surface meteorological data from 21 May to 20 Sep 1994 near the Southern Study Area-Old Jack Pine (SSA-OJP) tower site. The data are in tabular ASCII files. The surface meteorological data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  14. Investigation of surface changes of nanoparticles using TM-AFM phase imaging.

    PubMed

    Dong, Rong; Yu, Liya E

    2003-06-15

    Tapping-mode AFM (TM-AFM) phase imaging was utilized to characterize the surface changes of nanosize particles, in regard to the effects of different amounts of condensed water and organic coatings on particle surfaces. Model nanoparticles were continuously examined under various relative humidity (RH) levels by concurrently obtaining both topographic and phase images. The condensed water appeared to soften particle surfaces and to increase tip-sample attractive interaction over relatively stiff surfaces, which were shown with dark phase contrasts and negative phase shift values in phase images. Under high RH, a massive amount of water gave the particles a droplet-like surface, which reversed the original negative phase shifts to positive values with bright contrasts. Glutaric-acid coatings provided a compliant surface with high viscosity resulting in a dark phase contrast, whereas water droplets containing relatively low viscosity gave a bright phase contrast and positive phase shift. Overall, our results show that it is essential to describe the physical properties of a sample surface as solid, soft, or droplet-like material in order to derive a meaningful understanding of the surface changes of nanosize particles based on TM-AFM phase images. In contrast to other phase imaging studies, this work clearly correlates continuous surface changes with phase images, demonstrating a promising approach to characterize environmental nanoparticles.

  15. Fracture Growth Testing of Titanium 6AL-4V in AF-M315E

    NASA Technical Reports Server (NTRS)

    Sampson, Jeffrey W.; Martinez, Jonathan; McLean, Christopher

    2015-01-01

    The Green Propellant Infusion Mission (GPIM) will demonstrate the performance of AF-M315E monopropellant in orbit. Flight certification requires a safe-life analysis of the titanium alloy fuel tank to ensure inherent flaws will not cause failure during the design life. Material property inputs for this analysis require testing to determine the stress intensity factor for environmentally-assisted cracking (K (sub EAC)) of Ti 6Al-4V in combination with the AF-M315E monopropellant. Testing of single-edge notched specimens SE(B) representing the bulk tank membrane and weld material were performed in accordance with ASTM E1681. Specimens with fatigue pre-cracks were loaded into test fixtures so that the crack tips were exposed to the monopropellant at 50 degrees Centigrade for a duration of 1,000 hours. Specimens that did not fail during exposure were opened to inspect the crack surfaces for evidence of crack growth. The threshold stress intensity value, KEAC, is the highest applied stress intensity that produced neither a failure of the specimen during the exposure nor showed evidence of crack growth. The threshold stress intensity factor of the Ti 6Al-4V forged tank material when exposed to AF-M315E monopropellant was found to be at least 22.0 kilopounds per square inch. The stress intensity factor of the weld material was at least 31.3 kilopounds per square inch.

  16. Comparison of CD measurements of an EUV photomask by EUV scatterometry and CD-AFM

    NASA Astrophysics Data System (ADS)

    Scholze, Frank; Soltwisch, Victor; Dai, Gaoliang; Henn, Mark-Alexander; Gross, Hermann

    2013-09-01

    EUV scatterometry is a potential high-throughput measurement method for the characterization of EUV photomask structures. We present a comparison of angle resolved extreme ultraviolet (EUV) scatterometry and critical dimension atomic force microscope (CD-AFM) as a reference metrology for measurements of geometrical parameters like line width (CD), height and sidewall angle of EUV photomask structures. The structures investigated are dense and semidense bright and dark lines with different nominal CDs between 140 nm and 540 nm. The results show excellent linearity of the critical dimension measured with both methods within a range of only 1.8 nm and an offset of the absolute values below 3 nm. A maximum likelihood estimation (MLE) method is used to reconstruct the shape parameters and to estimate their uncertainties from the measured scattering efficiencies. The newly developed CD-AFM at PTB allows versatile measurements of parameters such as height, CD, sidewall angle, line edge/width roughness, corner rounding, and pitch. It applies flared tips to probe steep and even undercut sidewalls and employs a new vector approaching probing (VAP) strategy which enables very low tip wear and high measurement flexibility. Its traceability is ensured by a set of calibrated step-height and reference CD standards.

  17. Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

    PubMed Central

    Parkin, John D

    2016-01-01

    Summary Micro- and nanocantilevers are employed in atomic force microscopy (AFM) and in micro- and nanoelectromechanical systems (MEMS and NEMS) as sensing elements. They enable nanomechanical measurements, are essential for the characterization of nanomaterials, and form an integral part of many nanoscale devices. Despite the fact that numerous methods described in the literature can be applied to determine the static flexural spring constant of micro- and nanocantilever sensors, experimental techniques that do not require contact between the sensor and a surface at some point during the calibration process are still the exception rather than the rule. We describe a noncontact method using a microfluidic force tool that produces accurate forces and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8–160 N/m). PMID:27335740

  18. Multiwell micromechanical cantilever array reader for biotechnology

    NASA Astrophysics Data System (ADS)

    Zhang, R.; Best, A.; Berger, R.; Cherian, S.; Lorenzoni, S.; Macis, E.; Raiteri, R.; Cain, R.

    2007-08-01

    We use a multiwell micromechanical cantilever sensor (MCS) device to measure surface stress changes induced by specific adsorption of molecules. A multiplexed assay format facilitates the monitoring of the bending of 16 MCSs in parallel. The 16 MCSs are grouped within four separate wells. Each well can be addressed independently by different analyte liquids. This enables functionalization of MCS separately by flowing different solutions through each well. In addition, each well contains a fixed reference mirror which allows measuring the absolute bending of MCS. In addition, the mirror can be used to follow refractive index changes upon mixing of different solutions. The effect of the flow rate on the MCS bending change was found to be dependent on the absolute bending value of MCS. Experiments and finite element simulations of solution exchange in wells were performed. Both revealed that one solution can be exchanged by another one after 200μl volume has flown through. Using this device, the adsorption of thiolated DNA molecules and 6-mercapto-1-hexanol on gold surfaces was performed to test the nanomechanical response of MCS.

  19. Piezoresistive cantilever force-clamp system

    SciTech Connect

    Park, Sung-Jin; Petzold, Bryan C.; Pruitt, Beth L.; Goodman, Miriam B.

    2011-04-15

    We present a microelectromechanical device-based tool, namely, a force-clamp system that sets or ''clamps'' the scaled force and can apply designed loading profiles (e.g., constant, sinusoidal) of a desired magnitude. The system implements a piezoresistive cantilever as a force sensor and the built-in capacitive sensor of a piezoelectric actuator as a displacement sensor, such that sample indentation depth can be directly calculated from the force and displacement signals. A programmable real-time controller operating at 100 kHz feedback calculates the driving voltage of the actuator. The system has two distinct modes: a force-clamp mode that controls the force applied to a sample and a displacement-clamp mode that controls the moving distance of the actuator. We demonstrate that the system has a large dynamic range (sub-nN up to tens of {mu}N force and nm up to tens of {mu}m displacement) in both air and water, and excellent dynamic response (fast response time, <2 ms and large bandwidth, 1 Hz up to 1 kHz). In addition, the system has been specifically designed to be integrated with other instruments such as a microscope with patch-clamp electronics. We demonstrate the capabilities of the system by using it to calibrate the stiffness and sensitivity of an electrostatic actuator and to measure the mechanics of a living, freely moving Caenorhabditis elegans nematode.

  20. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.

    PubMed

    Campbellová, Anna; Ondráček, Martin; Pou, Pablo; Pérez, Rubén; Klapetek, Petr; Jelínek, Pavel

    2011-07-22

    A Si adatom on a Si(111)-(7 × 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

  1. Intraoperative fracture of phacoemulsification tip.

    PubMed

    Angmo, Dewang; Khokhar, Sudarshan K; Ganguly, Anasua

    2014-01-01

    Phacoemulsification (phaco) is an established procedure for cataract extraction and has undergone a significant advances in techniques, machines and phaco tips. The Aspiration Bypass System (ABS) phaco tip was introduced for phacoemulsification in 1998. The ABS tip allows fluid to be drawn through the opening when the phaco tip is occluded by nuclear material. The ABS tip allowed the safe use of high vacuum and flow rates and improved chamber stability by decreasing surge and therefore reducing intraoperative complications. To date, no disadvantages of ABS tips have been reported. We report a unique case of an intraoperative break of an ABS phaco tip during routine cataract surgery.

  2. Mechanical property investigation of soft materials by cantilever-based optical interfacial force microscopy.

    PubMed

    Kim, Byung I; Boehm, Ryan D

    2013-01-01

    Cantilever-based optical interfacial force microscopy (COIFM) was applied to the investigation of the mechanical properties of soft materials to avoid the double-spring effect and snap-to-contact problem associated with atomic force microscopy (AFM). When a force was measured as a function of distance between an oxidized silicon probe and the surface of a soft hydrocarbon film, it increases nonlinearly in the lower force region below ∼10 nN, following the Herzian model with the elastic modulus of ∼50 MPa. Above ∼10 nN, it increases linearly with a small oscillatory sawtooth pattern with amplitude 1-2 nN. The pattern suggests the possible existence of the layered structure within the film. When its internal part of the film was exposed to the probe, the force depends on the distance linearly with an adhesive force of -20 nN. This linear dependence suggests that the adhesive internal material behaved like a linear spring with a spring constant of ∼1 N/m. Constant-force images taken in the repulsive and attractive contact regimes revealed additional features that were not observed in the images taken in the noncontact regime. At some locations, however, contrast inversions were observed between the two contact regimes while the average roughness remained constant. The result suggests that some embedded materials had spring constants different from those of the surrounding material. This study demonstrated that the COIFM is capable of imaging mechanical properties of local structures such as small impurities and domains at the nanometer scale, which is a formidable challenge with conventional AFM methods.

  3. Energy harvesting of cantilever beam system with linear and nonlinear piezoelectric model

    NASA Astrophysics Data System (ADS)

    Borowiec, Marek

    2015-11-01

    The nonlinear beam with vertical combined excitations is proposed as an energy harvester. The nonlinearities are included both, in the beam model and also in the electrical subsystem. The system is modelled as a cantilever beam with included a tip mass and piezoelectric patches which convert the bending strains induced by both, the harmonic and the additive stochastic forces. The excitation affects in vertical directions by kinematic forcing into electrical charge. The first main goal is to analyse the dynamics of the electro-mechanical beam system and the influence of the mixed excitation forces into an effectiveness of the energy harvesting. Overcoming the potential barrier by the beam system is also analysed, where large output amplitudes occur. Such region of the vibration affects more power generation, which is crucial in terms of load resistors sensitivities. By increasing the additive noise level with fixed harmonic force it is observed the transition from single well oscillations to inter-well stochastic jumps. The second mail goal is analysing the influence of the piezoelectric nonlinear characteristic and compare the results to the linear piezoelectric cases. The output power is measured during different system behaviours provided by different piezoelectric characteristic as well as introduced stochastic components by modulated tip mass of the system.

  4. Experimental validation of a distributed parameter piezoelectric bimorph cantilever energy harvester

    NASA Astrophysics Data System (ADS)

    Rafique, S.; Bonello, P.

    2010-09-01

    Recent rapid advances in low-power portable electronic applications have motivated researchers and industry to explore schemes to embed an endless power supply mechanism within these systems. These self-charging embedded power supply systems convert ambient energy (vibration, solar, wind, etc) into electrical energy and subsequently provide power to these portable applications. Ambient vibration is one of the most promising sources of energy as it is abundantly present in indoor/outdoor systems. This paper discusses briefly the mathematical model of a bimorph piezoelectric cantilever beam with distributed inertia, and its experimental validation. Research on such a component typically included a tip mass, which reduced the influence of the distributed inertia of the beam and restricted effective operation to low frequencies. The present work excludes the tip mass and only the distributed mass of the harvester is considered. Due to the coupled electromechanical nature of piezoelectric materials, the effects of electrical coupling on the mechanical properties of the harvester are investigated, particularly the dependence of the induced additional stiffness and damping on the electrical load. Both the model and the experimental results show that the resonance frequency and the response amplitude of the harvester exhibit considerable shifts due to the electrical coupling. The experimental work uses both magnitude and Nyquist plots of the electromechanical frequency response functions to thoroughly validate the accuracy and applicability of the distributed parameter model at higher frequencies than previously considered.

  5. Nanofabrication of sharp diamond tips by e-beam lithography and inductively coupled plasma reactive ion etching.

    SciTech Connect

    Moldovan, N.; Divan, R.; Zeng, H.; Carlisle, J. A.; Advanced Diamond Tech.

    2009-12-07

    Ultrasharp diamond tips make excellent atomic force microscopy probes, field emitters, and abrasive articles due to diamond's outstanding physical properties, i.e., hardness, low friction coefficient, low work function, and toughness. Sharp diamond tips are currently fabricated as individual tips or arrays by three principal methods: (1) focused ion beam milling and gluing onto a cantilever of individual diamond tips, (2) coating silicon tips with diamond films, or (3) molding diamond into grooves etched in a sacrificial substrate, bonding the sacrificial substrate to another substrate or electrodepositing of a handling chip, followed by dissolution of the sacrificial substrate. The first method is tedious and serial in nature but does produce very sharp tips, the second method results in tips whose radius is limited by the thickness of the diamond coating, while the third method involves a costly bonding and release process and difficulties in thoroughly filling the high aspect ratio apex of molding grooves with diamond at the nanoscale. To overcome the difficulties with these existing methods, this article reports on the feasibility of the fabrication of sharp diamond tips by direct etching of ultrananocrystalline diamond (UNCD{reg_sign}) as a starting and structural material. The UNCD is reactive ion etched using a cap-precursor-mask scheme. An optimized etching recipe demonstrates the formation of ultrasharp diamond tips ({approx} 10 nm tip radius) with etch rates of 650 nm/min.

  6. SiC-Based Miniature High-Temperature Cantilever Anemometer

    NASA Technical Reports Server (NTRS)

    Okojie, Robert S.; Fralick, Gustave; Saad, George J.

    2004-01-01

    The figure depicts a miniature cantilever-type anemometer that has been developed as a prototype of compact, relatively nonintrusive anemometers that can function at temperatures up to 600 C and that can be expected to be commercially mass-producible at low cost. The design of this anemometer, and especially the packaging aspect of the design, is intended to enable measurement of turbulence in the high-temperature, high-vibration environment of a turbine engine or in any similar environment. The main structural components of the anemometer include a single-crystal SiC cantilever and two polycrystalline SiC clamping plates, all made from chemical-vapor-deposited silicon carbide. Fabrication of these components from the same basic material eliminates thermal-expansion mismatch, which has introduced spurious thermomechanical stresses in cantilever-type anemometers of prior design. The clamping plates are heavily oxidized to improve electrical insulation at high temperature. A cavity that serves as a receptacle for the clamped end of the cantilever is etched into one end of one clamping plate. Trenches that collectively constitute a socket for a multipin electrical plug (for connection to external electronic circuitry) are etched into the opposite end of this clamping plate. Metal strips for electrical contact are deposited on one face of the other clamping plate. Piezoresistive single-crystal SiC thin-film strain gauges are etched in the n-type SiC epilayer in a Wheatstone-bridge configuration. Metal contact pads on the cantilever that extend into the clamping-receptacle area, are obtained by deposition and patterning using standard semiconductor photolithography and etching methods. The cantilever and the two clamping plates are assembled into a sandwich structure that is then clamped in a stainless-steel housing. The Wheatstone- bridge carrying SiC cantilever with the metal contact pads on the piezoresistors is slid into the receptacle in the bottom clamping plate

  7. Tip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments.

    PubMed

    Shih, Hua-Ju; Shih, Po-Jen

    2015-07-28

    Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. Studies have noted that the heights of protein surfaces measured via the tapping mode of an atomic force microscope are ~25% smaller than those measured by other methods. This discrepancy may be attributable to the induced superficial hydrodynamic pressure, which is worth investigating. In this paper, we introduce a semi-analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone-shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is 20 times larger than the pressure without considering the tip effect; these results have not been motioned in other papers. Dominating factors, such as surface heights of protein surface, mechanical stiffness of protein increasing with loading velocity, and radius of tip affecting the local pressure of specimen, are also addressed in this study.

  8. Efficiency enhancement of a cantilever-based vibration energy harvester.

    PubMed

    Kubba, Ali E; Jiang, Kyle

    2013-12-23

    Extracting energy from ambient vibration to power wireless sensor nodes has been an attractive area of research, particularly in the automotive monitoring field. This article reports the design, analysis and testing of a vibration energy harvesting device based on a miniature asymmetric air-spaced cantilever. The developed design offers high power density, and delivers electric power that is sufficient to support most wireless sensor nodes for structural health monitoring (SHM) applications. The optimized design underwent three evolutionary steps, starting from a simple cantilever design, going through an air-spaced cantilever, and ending up with an optimized air-spaced geometry with boosted power density level. Finite Element Analysis (FEA) was used as an initial tool to compare the three geometries' stiffness (K), output open-circuit voltage (V(ave)), and average normal strain in the piezoelectric transducer (ε(ave)) that directly affect its output voltage. Experimental tests were also carried out in order to examine the energy harvesting level in each of the three designs. The experimental results show how to boost the power output level in a thin air-spaced cantilever beam for energy within the same space envelope. The developed thin air-spaced cantilever (8.37 cm3), has a maximum power output of 2.05 mW (H = 29.29 μJ/cycle).

  9. Nonlinear resonances of a single-wall carbon nanotube cantilever

    NASA Astrophysics Data System (ADS)

    Kim, I. K.; Lee, S. I.

    2015-03-01

    The dynamics of an electrostatically actuated carbon nanotube (CNT) cantilever are discussed by theoretical and numerical approaches. Electrostatic and intermolecular forces between the single-walled CNT and a graphene electrode are considered. The CNT cantilever is analyzed by the Euler-Bernoulli beam theory, including its geometric and inertial nonlinearities, and a one-mode projection based on the Galerkin approximation and numerical integration. Static pull-in and pull-out behaviors are adequately represented by an asymmetric two-well potential with the total potential energy consisting of the CNT elastic energy, electrostatic energy, and the Lennard-Jones potential energy. Nonlinear dynamics of the cantilever are simulated under DC and AC voltage excitations and examined in the frequency and time domains. Under AC-only excitation, a superharmonic resonance of order 2 occurs near half of the primary frequency. Under both DC and AC loads, the cantilever exhibits linear and nonlinear primary and secondary resonances depending on the strength of the excitation voltages. In addition, the cantilever has dynamic instabilities such as periodic or chaotic tapping motions, with a variation of excitation frequency at the resonance branches. High electrostatic excitation leads to complex nonlinear responses such as softening, multiple stability changes at saddle nodes, or period-doubling bifurcation points in the primary and secondary resonance branches.

  10. Improved Sensitivity MEMS Cantilever Sensor for Terahertz Photoacoustic Spectroscopy

    PubMed Central

    Coutu, Ronald A.; Medvedev, Ivan R.; Petkie, Douglas T.

    2016-01-01

    In this paper, a microelectromechanical system (MEMS) cantilever sensor was designed, modeled and fabricated to measure the terahertz (THz) radiation induced photoacoustic (PA) response of gases under low vacuum conditions. This work vastly improves cantilever sensitivity over previous efforts, by reducing internal beam stresses, minimizing out of plane beam curvature and optimizing beam damping. In addition, fabrication yield was improved by approximately 50% by filleting the cantilever’s anchor and free end to help reduce high stress areas that occurred during device fabrication and processing. All of the cantilever sensors were fabricated using silicon-on-insulator (SOI) wafers and tested in a custom built, low-volume, vacuum chamber. The resulting cantilever sensors exhibited improved signal to noise ratios, sensitivities and normalized noise equivalent absorption (NNEA) coefficients of approximately 4.28 × 10−10 cm−1·WHz−1/2. This reported NNEA represents approximately a 70% improvement over previously fabricated and tested SOI cantilever sensors for THz PA spectroscopy. PMID:26907280

  11. High resolved velocity measurements using Laser Cantilever Anemometry

    NASA Astrophysics Data System (ADS)

    Puczylowski, Jaroslaw; Hölling, Michael; Peinke, Joachim

    2016-11-01

    We have developed a new anemometer, namely the 2d-LCA (2d-Laser-Cantilever-Anemometer), that is capable of performing high resolved velocity measurements in fluids. The anemometer uses a micostructured cantilever made of silicon as a sensing element. The specific shape and the small dimensions (about 150µm) of the cantilever allow for precise measurements of two velocity component at a temporal resolution of about 150kHz. The angular acceptance range is 180° in total. The 2d-LCA is a simple to use alternative to x-wires and can be used in many areas of operation including measurements in liquids or in particle-laden flows. Unlike hot-wires, the resolution power of the 2d-LCA does not decrease with increasing flow velocity, making it particularly suitable for measurements in high-speed flows. In the recent past new cantilever designs were implemented with the goal to further improve the angular resolution and increase the stability. In addition, we have designed more robust cantilevers for measurements in rough environments such as offshore areas. Successful comparative measurements with hot-wires have been carried out in order to assess the performance of the 2d-LCA.

  12. Efficiency Enhancement of a Cantilever-Based Vibration Energy Harvester

    PubMed Central

    Kubba, Ali E.; Jiang, Kyle

    2014-01-01

    Extracting energy from ambient vibration to power wireless sensor nodes has been an attractive area of research, particularly in the automotive monitoring field. This article reports the design, analysis and testing of a vibration energy harvesting device based on a miniature asymmetric air-spaced cantilever. The developed design offers high power density, and delivers electric power that is sufficient to support most wireless sensor nodes for structural health monitoring (SHM) applications. The optimized design underwent three evolutionary steps, starting from a simple cantilever design, going through an air-spaced cantilever, and ending up with an optimized air-spaced geometry with boosted power density level. Finite Element Analysis (FEA) was used as an initial tool to compare the three geometries' stiffness (K), output open-circuit voltage (Vave), and average normal strain in the piezoelectric transducer (εave) that directly affect its output voltage. Experimental tests were also carried out in order to examine the energy harvesting level in each of the three designs. The experimental results show how to boost the power output level in a thin air-spaced cantilever beam for energy within the same space envelope. The developed thin air-spaced cantilever (8.37 cm3), has a maximum power output of 2.05 mW (H = 29.29 μJ/cycle). PMID:24366177

  13. Evolving Indications for Tips.

    PubMed

    Smith, Mitchell; Durham, Janette

    2016-03-01

    Transjugular intrahepatic portosystemic shunt creation is a well-established therapy for refractory variceal bleeding and refractory ascites in patients who do not tolerate repeated large volume paracentesis. Experience and technical improvements including covered stents have led to improved TIPS outcomes that have encouraged an expanded application. Evidence for other less frequent indications continues to accumulate, including the indications of primary prophylaxis in patients with high-risk acute variceal bleeding, gastric and ectopic variceal bleeding, primary treatment of medically refractory ascites, recurrent refractory ascites following liver transplantation, hepatic hydrothorax, hepatorenal syndrome, Budd-Chiari syndrome, and portal vein thrombosis. Treatment of patients with high-risk acute variceal bleeding with early TIPS and using transjugular intrahepatic portosystemic shunts as a primary therapy rather than large volume paracentesis for refractory ascites would likely be the 2 circumstances that permit expansion in the frequency of TIPS procedures. The remaining populations discussed above are relatively rare.

  14. Magnet pole tips

    DOEpatents

    Thorn, Craig E.; Chasman, Chellis; Baltz, Anthony J.

    1984-04-24

    An improved magnet which more easily provides a radially increasing magnetic field, as well as reduced fringe field and requires less power for a given field intensity. The subject invention comprises a pair of spaced, opposed magnetic poles which further comprise a pair of pole roots, each having a pole tip attached to its center. The pole tips define the gap between the magnetic poles and at least a portion of each pole tip is separated from its associated pole root. The separation begins at a predetermined distance from the center of the pole root and increases with increasing radial distance while being constant with azimuth within that portion. Magnets in accordance with the subject invention have been found to be particularly advantageous for use in large isochronous cyclotrons.

  15. Magnet pole tips

    DOEpatents

    Thorn, C.E.; Chasman, C.; Baltz, A.J.

    1981-11-19

    An improved magnet more easily provides a radially increasing magnetic field, as well as reduced fringe field and requires less power for a given field intensity. The subject invention comprises a pair of spaced, opposed magnetic poles which further comprise a pair of pole roots, each having a pole tip attached to its center. The pole tips define the gap between the magnetic poles and at least a portion of each pole tip is separated from its associated pole root. The separation begins at a predetermined distance from the center of the pole root and increases with increasing radial distance while being constant with azimuth within that portion. Magnets in accordance with the subject invention have been found to be particularly advantageous for use in large isochronous cyclotrons.

  16. BOREAS AFM-6 Boundary Layer Height Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) site. This data set provides boundary layer height information over the site. The data were collected from 21 May 1994 to 20 Sep 1994 and are stored in tabular ASCII files. The boundary layer height data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  17. BOREAS AFM-06 Mean Wind Profile Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Administration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) tower from 21 May 1994 to 20 Sep 1994. The data set provides wind profiles at 38 heights, containing the variables of wind speed; wind direction; and the u-, v-, and w-components of the total wind. The data are stored in tabular ASCII files. The mean wind profile data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  18. BOREAS AFM-06 Mean Temperature Profile Data

    NASA Technical Reports Server (NTRS)

    Wilczak, James; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Smith, David E. (Technical Monitor)

    2000-01-01

    The Boreal Ecosystem-Atmosphere Study (BOREAS) Airborne Fluxes and Meteorology (AFM)-6 team from the National Oceanic and Atmospheric Adminsitration/Environment Technology Laboratory (NOAA/ETL) operated a 915-MHz wind/Radio Acoustic Sounding System (RASS) profiler system in the Southern Study Area (SSA) near the Old Jack Pine (OJP) tower from 21 May 1994 to 20 Sep 1994. The data set provides temperature profiles at 15 heights, containing the variables of virtual temperature, vertical velocity, the speed of sound, and w-bar. The data are stored in tabular ASCII files. The mean temperature profile data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  19. Cryogenic AFM-STM for mesoscopic physics

    NASA Astrophysics Data System (ADS)

    Le Sueur, H.

    Electronic spectroscopy based on electron tunneling gives access to the electronic density of states (DOS) in conductive materials, and thus provides detailed information about their electronic properties. During this thesis work, we have developed a microscope in order to perform spatially resolved (10 nm) tunneling spectroscopy, with an unprecedented energy resolution (10 μeV), on individual nanocircuits. This machine combines an Atomic Force Microscope (AFM mode) together with a Scanning Tunneling Spectroscope (STS mode) and functions at very low temperatures (30 mK). In the AFM mode, the sample topography is recorded using a piezoelectric quartz tuning fork, which allows us to locate and image nanocircuits. Tunneling can then be performed on conductive areas of the circuit. With this microscope, we have measured the local DOS in a hybrid Superconductor-Normal metal-Superconductor (S-N-S) structure. In such circuit, the electronic properties of N and S are modified by the superconducting proximity effect. In particular, for short N wires, we have observed a minigap independent of position in the DOS of the N wire, as was previously predicted. Moreover, when varying the superconducting phase difference between the S electrodes, we have measured the modification of the minigap and its disappearance when the phase difference equals π. Our experimental results for the DOS, and its dependences (on phase, position, N length), are quantitatively accounted for by the quasiclassical theory of superconductivity. Some predictions of this theory are observed for the first time. La spectroscopie électronique basée sur l'effet tunnel donne accès à la densité d'états des électrons (DOS) dans les matériaux conducteurs, et renseigne ainsi en détail sur leurs propriétés électroniques. Au cours de cette thèse, nous avons développé un microscope permettant d'effectuer la spectroscopie tunnel résolue spatialement (10 nm) de nanocircuits individuels, avec une r

  20. Long-tip high-speed atomic force microscopy for nanometer-scale imaging in live cells

    PubMed Central

    Shibata, Mikihiro; Uchihashi, Takayuki; Ando, Toshio; Yasuda, Ryohei

    2015-01-01

    Visualization of morphological dynamics of live cells with nanometer resolution under physiological conditions is highly desired, but challenging. It has been demonstrated that high-speed atomic force microscopy is a powerful technique for visualizing dynamics of biomolecules under physiological conditions. However, application of high-speed atomic force microscopy for imaging larger objects such as live mammalian cells has been complicated because of the collision between the cantilever and samples. Here, we demonstrate that attaching an extremely long (~3 μm) and thin (~5 nm) tip by amorphous carbon to the cantilever allows us to image the surface structure of live cells with the spatiotemporal resolution of nanometers and seconds. We demonstrate that long-tip high-speed atomic force microscopy is capable of imaging morphogenesis of filopodia, membrane ruffles, pit formation, and endocytosis in COS-7, HeLa cells and hippocampal neurons. PMID:25735540

  1. Long-tip high-speed atomic force microscopy for nanometer-scale imaging in live cells

    NASA Astrophysics Data System (ADS)

    Shibata, Mikihiro; Uchihashi, Takayuki; Ando, Toshio; Yasuda, Ryohei

    2015-03-01

    Visualization of morphological dynamics of live cells with nanometer resolution under physiological conditions is highly desired, but challenging. It has been demonstrated that high-speed atomic force microscopy is a powerful technique for visualizing dynamics of biomolecules under physiological conditions. However, application of high-speed atomic force microscopy for imaging larger objects such as live mammalian cells has been complicated because of the collision between the cantilever and samples. Here, we demonstrate that attaching an extremely long (~3 μm) and thin (~5 nm) tip by amorphous carbon to the cantilever allows us to image the surface structure of live cells with the spatiotemporal resolution of nanometers and seconds. We demonstrate that long-tip high-speed atomic force microscopy is capable of imaging morphogenesis of filopodia, membrane ruffles, pit formation, and endocytosis in COS-7, HeLa cells and hippocampal neurons.

  2. Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments

    PubMed Central

    Guzman, Horacio V; Garcia, Pablo D

    2015-01-01

    Summary We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever–tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the instantaneous deflection and tip–surface force, velocity, virial, dissipated energy, sample deformation and peak force as a function of time or distance. The simulator includes a variety of interactions and contact mechanics models to describe AFM experiments including: van der Waals, Hertz, DMT, JKR, bottom effect cone correction, linear viscoelastic forces or the standard linear solid viscoelastic model. We have compared two numerical integration methods to select the one that offers optimal accuracy and speed. The graphical user interface has been designed to facilitate the navigation of non-experts in simulations. Finally, the accuracy of dForce has been tested against numerical simulations performed during the last 18 years. PMID:25821676

  3. Assembly of live micro-organisms on microstructured PDMS stamps by convective/capillary deposition for AFM bio-experiments.

    PubMed

    Dague, E; Jauvert, E; Laplatine, L; Viallet, B; Thibault, C; Ressier, L

    2011-09-30

    Immobilization of live micro-organisms on solid substrates is an important prerequisite for atomic force microscopy (AFM) bio-experiments. The method employed must immobilize the cells firmly enough to enable them to withstand the lateral friction forces exerted by the tip during scanning but without denaturing the cell interface. In this work, a generic method for the assembly of living cells on specific areas of substrates is proposed. It consists in assembling the living cells within the patterns of microstructured, functionalized poly-dimethylsiloxane (PDMS) stamps using convective/capillary deposition. This versatile approach is validated by applying it to two systems of foremost importance in biotechnology and medicine: Saccharomyces cerevisiae yeasts and Aspergillus fumigatus fungal spores. We show that this method allows multiplexing AFM nanomechanical measurements by force spectroscopy on S. cerevisiae yeasts and high-resolution AFM imaging of germinated Aspergillus conidia in buffer medium. These two examples clearly demonstrate the immense potential of micro-organism assembly on functionalized, microstructured PDMS stamps by convective/capillary deposition for performing rigorous AFM bio-experiments on living cells.

  4. Assembly of live micro-organisms on microstructured PDMS stamps by convective/capillary deposition for AFM bio-experiments

    NASA Astrophysics Data System (ADS)

    Dague, E.; Jauvert, E.; Laplatine, L.; Viallet, B.; Thibault, C.; Ressier, L.

    2011-09-01

    Immobilization of live micro-organisms on solid substrates is an important prerequisite for atomic force microscopy (AFM) bio-experiments. The method employed must immobilize the cells firmly enough to enable them to withstand the lateral friction forces exerted by the tip during scanning but without denaturing the cell interface. In this work, a generic method for the assembly of living cells on specific areas of substrates is proposed. It consists in assembling the living cells within the patterns of microstructured, functionalized poly-dimethylsiloxane (PDMS) stamps using convective/capillary deposition. This versatile approach is validated by applying it to two systems of foremost importance in biotechnology and medicine: Saccharomyces cerevisiae yeasts and Aspergillus fumigatus fungal spores. We show that this method allows multiplexing AFM nanomechanical measurements by force spectroscopy on S. cerevisiae yeasts and high-resolution AFM imaging of germinated Aspergillus conidia in buffer medium. These two examples clearly demonstrate the immense potential of micro-organism assembly on functionalized, microstructured PDMS stamps by convective/capillary deposition for performing rigorous AFM bio-experiments on living cells.

  5. EcoTipping Points

    ERIC Educational Resources Information Center

    Marten, Gerald G.; Matthews, Catherine E.

    2009-01-01

    Contrary to what we often hear and teach, there is good news to be found on the environmental front. Environmental success stories show us not only that sustainability is possible, but also how people have made it happen. We can make these stories and their lessons accessible to students with help from the EcoTipping Points Project, which has…

  6. Tips from the Classroom.

    ERIC Educational Resources Information Center

    Benedetti, Teresa; De Gaetano, Yvonne; Weinstein-McShane, Ruth; Paez, Doris; McCarty, Laurie; Ehlers-Zavala, Fabiola; Bakken, Jeffrey P.

    1997-01-01

    This group of classroom tips discusses the benefits of peer coaching, peer group conversation about teachers' classroom experiences, using visual displays for collegial sharing, using cultural brokers in educational settings, and the role of picture books in developing literacy skills in diverse students with disabilities. (Author/CK)

  7. Tips for Energy Savers.

    ERIC Educational Resources Information Center

    Department of Energy, Washington, DC.

    According to 1986 U.S. Department of Energy data, 48% of our residential energy is used to heat and cool our homes, 16% goes for heating water, 12% is used to refrigerators and freezers, and the remaining 24% goes into lighting, cooking, and running appliances. This booklet contains tips for saving energy, including sections on: (1) draft-proof…

  8. Newsletter Design Tips.

    ERIC Educational Resources Information Center

    Welch, Sally

    This paper presents detailed tips on newsletter design. Following an overview, it discusses effective design, anatomy of a page, type, designing tools (organizational tools, text organizers, emphasizing tools, and graphics, presented with some do's and don'ts), and a list of other items to consider. Three appendixes contain a brief glossary of…

  9. A surface-acoustic-wave-based cantilever bio-sensor.

    PubMed

    De Simoni, Giorgio; Signore, Giovanni; Agostini, Matteo; Beltram, Fabio; Piazza, Vincenzo

    2015-06-15

    A scalable surface-acoustic-wave- (SAW-) based cantilevered device for portable bio-chemical sensing applications is presented. Even in the current, proof-of-principle implementation this architecture is shown to outperform commercial quartz-crystal microbalances in terms of sensitivity. Adhesion of analytes on a functionalized surface of the cantilever shifts the resonant frequency of a SAW-generating transducer due to the stress-induced variation of the speed of surface acoustic modes. We discuss the relevance of this approach for diagnostics applications based on miniaturized devices.

  10. Magnetostriction-driven cantilevers for dynamic atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Penedo, M.; Fernández-Martínez, I.; Costa-Krämer, J. L.; Luna, M.; Briones, F.

    2009-10-01

    An actuation mode is presented to drive the mechanical oscillation of cantilevers for dynamic atomic force microscopy. The method is based on direct mechanical excitation of the cantilevers coated with amorphous Fe-B-N thin films, by means of the film magnetostriction, i.e., the dimensional change in the film when magnetized. These amorphous magnetostrictive Fe-B-N thin films exhibit soft magnetic properties, excellent corrosion resistance in liquid environments, nearly zero accumulated stress when properly deposited, and good chemical stability. We present low noise and high resolution topographic images acquired in liquid environment to demonstrate the method capability.

  11. Free torsional vibrations of tapered cantilever I-beams

    NASA Astrophysics Data System (ADS)

    Rao, C. Kameswara; Mirza, S.

    1988-08-01

    Torsional vibration characteristics of linearly tapered cantilever I-beams have been studied by using the Galerkin finite element method. A third degree polynomial is assumed for the angle of twist. The analysis presented is valid for long beams and includes the effect of warping. The individual as well as combined effects of linear tapers in the width of the flanges and the depth of the web on the torsional vibration of cantilever I-beams are investigated. Numerical results generated for various values of taper ratios are presented in graphical form.

  12. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

    SciTech Connect

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-15

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  13. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications.

    PubMed

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-01

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  14. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

    NASA Astrophysics Data System (ADS)

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-01

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  15. Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry.

    PubMed

    Jin, X; Kasal, B

    2016-10-01

    This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

  16. Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

    NASA Astrophysics Data System (ADS)

    Jin, X.; Kasal, B.

    2016-10-01

    This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

  17. Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

    PubMed Central

    Kasal, B.

    2016-01-01

    This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness. PMID:27853541

  18. Measuring the viscoelastic creep of soft samples by step response AFM.

    PubMed

    Yango, Achu; Schäpe, Jens; Rianna, Carmela; Doschke, Holger; Radmacher, Manfred

    2016-10-12

    We have measured the creep response of soft gels and cells after applying a step in loading force with atomic force microscopy (AFM). By analysing the creep response data using the standard linear solid model, we can quantify the viscous and elastic properties of these soft samples independently. Cells, in comparison with gels of similar softness, are much more viscous, as has been qualitatively observed in conventional force curve data before. Here, we quantify the spring constant and the viscous damping coefficient from the creep response data. We propose two different modes for applying a force step: (1) indirectly by increasing the sample height or (2) directly by employing magnetic cantilevers. Both lead to similar results, whereas the latter seems to be better defined since it resembles closely a constant strain mode. The former is easier to implement in most instruments, and thus may be preferable from a practical point of view. Creep analysis by step response is much more appropriate to analyse the viscoelastic response of soft samples like cells than the usually used force curve analysis.

  19. Tipping off endothelial tubes: nitric oxide drives tip cells.

    PubMed

    Priya, Mani Krishna; Sahu, Giriraj; Soto-Pantoja, David R; Goldy, Naga; Sundaresan, Abaya Meenakshi; Jadhav, Vivek; Barathkumar, T R; Saran, Uttara; Jaffar Ali, B M; Roberts, David D; Bera, Amal Kanti; Chatterjee, Suvro

    2015-04-01

    Angiogenesis, the formation of new blood vessels from pre-existing vessels, is a complex process that warrants cell migration, proliferation, tip cell formation, ring formation, and finally tube formation. Angiogenesis is initiated by a single leader endothelial cell called "tip cell," followed by vessel elongation by "stalk cells." Tip cells are characterized by their long filopodial extensions and expression of vascular endothelial growth factor receptor-2 and endocan. Although nitric oxide (NO) is an important modulator of angiogenesis, its role in angiogenic sprouting and specifically in tip cell formation is poorly understood. The present study tested the role of endothelial nitric oxide synthase (eNOS)/NO/cyclic GMP (cGMP) signaling in tip cell formation. In primary endothelial cell culture, about 40% of the tip cells showed characteristic sub-cellular localization of eNOS toward the anterior progressive end of the tip cells, and eNOS became phosphorylated at serine 1177. Loss of eNOS suppressed tip cell formation. Live cell NO imaging demonstrated approximately 35% more NO in tip cells compared with stalk cells. Tip cells showed increased level of cGMP relative to stalk cells. Further, the dissection of NO downstream signaling using pharmacological inhibitors and inducers indicates that NO uses the sGC/cGMP pathway in tip cells to lead angiogenesis. Taken together, the present study confirms that eNOS/NO/cGMP signaling defines the direction of tip cell migration and thereby initiates new blood vessel formation.

  20. 14. TIP TOP MINE. TAILINGS LOCATED DIRECTLY WEST FROM TIP ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    14. TIP TOP MINE. TAILINGS LOCATED DIRECTLY WEST FROM TIP TOP HOUSE. ID-31-C-12 WOODEN STRUCTURE IS VISIBLE IN TOP LEFT. CABLES VISIBLE LEFT AND CENTER OF TAILINGS. HOUSE IS JUST OVER APEX OF TAILINGS. CAMERA POINTED EAST. - Florida Mountain Mining Sites, Tip Top Mine, West face Florida Mountain, approximately 150 feet below summit, Silver City, Owyhee County, ID

  1. Contact resonance AFM to quantify the in-plane and out-of-plane loss tangents of polymers simultaneously

    NASA Astrophysics Data System (ADS)

    Rezaei, E.; Turner, J. A.

    2017-03-01

    Contact resonance atomic force microscope (AFM) methods are used to quantify the elastic and viscoelastic properties of numerous materials including polymers. More recently, U-shaped AFM thermalevers have been developed to allow the local heating of samples, and the resonances of these probes are much more complex. These probes also allow the in-plane and out-of-plane tip-sample motion to be excited independently at the same location using a Lorentz force excitation. Here, such a probe is used to determine the in-plane and out-of-plane viscoelastic properties at the same location. The approach is demonstrated with respect to the indentation and shear loss tangents on high-density polyethylene and polystyrene.

  2. Preparation of DNA and nucleoprotein samples for AFM imaging

    PubMed Central

    Lyubchenko, Yuri L.

    2010-01-01

    Sample preparation techniques allowing reliable and reproducible imaging of DNA with various structures, topologies and complexes with proteins are reviewed. The major emphasis is given to methods utilizing chemical functionalization of mica, enabling preparation of the surfaces with required characteristics. The methods are illustrated by examples of imaging of different DNA structures. Special attention is given to the possibility of AFM to image the dynamics of DNA at the nanoscale. The capabilities of time-lapse AFM in aqueous solutions are illustrated by imaging of dynamic processes as transitions of local alternative structures (transition of DNA between H and B forms). The application of AFM to studies of protein-DNA complexes is illustrated by a few examples of imaging site-specific complexes, as well as such systems as chromatin. The time-lapse AFM studies of protein-DNA complexes including very recent advances with the use of high-speed AFM are reviewed. PMID:20864349

  3. Safety Tips: Baseball (For Parents)

    MedlinePlus

    ... by U.S.A. Little League and the American Sports Medicine Institute: 7-8 years old: 50 pitches a ... ON THIS TOPIC Signing Kids Up for Sports Sports Medicine Center Safety Tips: Hockey Safety Tips: Basketball Competitive ...

  4. Flutter parametric studies of cantilevered twin-engine-transport type wing with and without winglet. Volume 1: Low-speed investigations

    NASA Technical Reports Server (NTRS)

    Bhatia, K. G.; Nagaraja, K. S.

    1984-01-01

    Flutter characteristics of a cantilevered high aspect ratio wing with winglet were investigated. The configuration represented a current technology, twin-engine airplane. A low-speed and high-speed model were used to evaluate compressibility effects through transonic Mach numbers and a wide range of mass-density ratios. Four flutter mechanisms were obtained in test, as well as analysis from various combinations of configuration parameters. The coupling between wing tip vertical and chordwise motions was shown to have significant effect under some conditions. It is concluded that for the flutter model configurations studied, the winglet related flutter was amenable to the conventional flutter analysis techniques.

  5. BOREAS AFM-07 SRC Surface Meteorological Data

    NASA Technical Reports Server (NTRS)

    Osborne, Heather; Hall, Forrest G. (Editor); Newcomer, Jeffrey A. (Editor); Young, Kim; Wittrock, Virginia; Shewchuck, Stan; Smith, David E. (Technical Monitor)

    2000-01-01

    The Saskatchewan Research Council (SRC) collected surface meteorological and radiation data from December 1993 until December 1996. The data set comprises Suite A (meteorological and energy balance measurements) and Suite B (diffuse solar and longwave measurements) components. Suite A measurements were taken at each of ten sites, and Suite B measurements were made at five of the Suite A sites. The data cover an approximate area of 500 km (North-South) by 1000 km (East-West) (a large portion of northern Manitoba and northern Saskatchewan). The measurement network was designed to provide researchers with a sufficient record of near-surface meteorological and radiation measurements. The data are provided in tabular ASCII files, and were collected by Aircraft Flux and Meteorology (AFM)-7. The surface meteorological and radiation data are available from the Earth Observing System Data and Information System (EOSDIS) Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC). The data files are available on a CD-ROM (see document number 20010000884).

  6. DETAIL OF FRONT ENTRY AT UNIT B. SHOWING THE CANTILEVERED ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    DETAIL OF FRONT ENTRY AT UNIT B. SHOWING THE CANTILEVERED CONCRETE CANOPY WITH ROUNDED CORNERS, STEPPED DOORWAY SURROUND, AND BAY WINDOW. NOTE THE DECORATIVE GRILLE AT THE VENT OF THE SECOND FLOOR CLOSET. VIEW FACING NORTH. - Hickam Field, Officers' Housing Type N, 204B Second Street, Honolulu, Honolulu County, HI

  7. Strategy Guideline: Quality Management in Existing Homes - Cantilever Floor Example

    SciTech Connect

    Taggart, J.; Sikora, J.; Wiehagen, J.; Wood, A.

    2011-12-01

    This guideline is designed to highlight the QA process that can be applied to any residential building retrofit activity. The cantilevered floor retrofit detailed in this guideline is included only to provide an actual retrofit example to better illustrate the QA activities being presented.

  8. 13. DETAIL OF SOUTH PIER TOP (WEST SIDE) AND CANTILEVERED ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    13. DETAIL OF SOUTH PIER TOP (WEST SIDE) AND CANTILEVERED SIDEWALK. LOOKING NORTH. - Route 31 Bridge, New Jersey Route 31, crossing disused main line of Central Railroad of New Jersey (C.R.R.N.J.) (New Jersey Transit's Raritan Valley Line), Hampton, Hunterdon County, NJ

  9. Performance evaluation of perforated micro-cantilevers for MEMS applications

    NASA Astrophysics Data System (ADS)

    Swamy, Kenkere Balashanthamurthy Mruthyunjaya; Mukherjee, Banibrata; Ali Syed Mohammed, Zishan; Chakraborty, Suman; Sen, Siddhartha

    2014-04-01

    Miniaturized cantilevers are one of the elementary structures that are widely used in many micro-devices and systems. The dynamic performance of micro-cantilevers having process dictated through perforations is investigated. High-aspect ratio, long silicon cantilevers, intended for improved performance through lowered stiffness are designed with a series of through holes and simulated along with similar nonperforated/solid cantilevers for comparison. A few perforated structures are also fabricated using silicon-on-insulator-based multiproject MEMS processes from MEMSCAP Inc. (Durham, North Carolina) by reduced mask level and eliminating complex substrate trenching step. The dynamic behavior of these fabricated structures is experimentally studied for both in-plane and out-of-plane directions. It is shown that, due to the presence of perforations, stiffness in planar direction is lightly affected, whereas in out-of-plane direction it is significantly reduced by >35%. Similarly, the variation of damping in both perforated and nonperforated beams, too, is thoroughly analyzed for the first few modes of vibration. Nevertheless, their frequency response variation of <10% for modal frequencies in both planar and out-of-plane directions as compared to the nonperforated counterparts, points to potential applications in several micro-systems including those based on comb drives.

  10. Sensitivity measurement of a cantilever-based surface stress sensor

    NASA Astrophysics Data System (ADS)

    Haag, Ann-Lauriene; Schumacher, Zeno; Grutter, Peter

    2016-10-01

    A detailed analysis of the temporal surface stress evolution for potential-driven adsorption of ions is discussed. A gold-coated cantilever is used to simultaneously measure the change in surface stress as well as the current response during an applied potential step. In this electrochemical configuration, the cantilever acts as the working electrode, a platinum wire as the counter electrode, and the Ag/AgCl (sat. KCl) electrode as the reference electrode. To study the time-dependent signal and the sensitivity of the cantilever response, the frequency of the potential step applied to the cantilever is varied from 1 s to 0.1 ms. First, a comparison between a strong adsorbing (chloride Cl-) and a weak adsorbing ion (perchlorate ClO 4- ) in a 1 mM solution is presented. Next, the linear relationship between surface stress and charge density is measured for these fast potential steps. The slope of this fit is defined as the sensitivity of the system and is shown to increase for shorter potential pulses. Finally, the behaviour of the surface stress and current for consecutive applied potential steps is studied.

  11. Multiferroic cantilever for power generation using dual functionality

    NASA Astrophysics Data System (ADS)

    Gupta, Reema; Tomar, Monika; Rammohan, S.; Katiyar, R. S.; Gupta, Vinay

    2016-11-01

    Lead zirconate titanate (PZT)/Ni cantilevers have been developed using the pulsed laser deposition technique for harnessing magnetic as well as mechanical energy. High voltage (1.2 mV, 1.8 mV, and 8.5 mV) and power density (1100, 2400, and 3600 mW/m3) were generated across the PZT/Ni cantilevers (in 3-3 mode) having PZT thin films deposited at 100 mTorr, 200 mTorr, and 300 mTorr oxygen pressures, respectively, at their respective resonance frequencies with 0.5 g acceleration. Maximum power response (3600 mW/m3) was observed at a load resistance of 100 kΩ for the cantilever having PZT film deposited at 300 mTorr oxygen pressure, which is manifested to the efficient ferroelectric and ferromagnetic properties of PZT/Ni system. The power generated from the PZT/Ni cantilever was further enhanced to 18 700 mW/m3 by superimposing magnetic energy with mechanical vibrations. These results are extremely promising for the realization of an efficient energy harvester utilizing both magnetic and mechanical energy.

  12. Cantilever deflection associated with hybridization of monomolecular DNA film

    NASA Astrophysics Data System (ADS)

    Zhao, Yue; Ganapathysubramanian, Baskar; Shrotriya, Pranav

    2012-04-01

    Recent experiments show that specific binding between a ligand and surface immobilized receptor, such as hybridization of single stranded DNA immobilized on a microcantilever surface, leads to cantilever deflection. The binding-induced deflection may be used as a method for detection of biomolecules, such as pathogens and biohazards. Mechanical deformation induced due to hybridization of surface-immobilized DNA strands is a commonly used system to demonstrate the efficacy of microcantilever sensors. To understand the mechanism underlying the cantilever deflections, a theoretical model that incorporates the influence of ligand/receptor complex surface distribution and empirical interchain potential is developed to predict the binding-induced deflections. The cantilever bending induced due to hybridization of DNA strands is predicted for different receptor immobilization densities, hybridization efficiencies, and spatial arrangements. Predicted deflections are compared with experimental reports to validate the modeling assumptions and identify the influence of various components on mechanical deformation. Comparison of numerical predictions and experimental results suggest that, at high immobilization densities, hybridization-induced mechanical deformation is determined, primarily by immobilization density and hybridization efficiency, whereas, at lower immobilization densities, spatial arrangement of hybridized chains need to be considered in determining the cantilever deflection.

  13. On-Tip Photo-Modulated Molecular Printing.

    PubMed

    Xie, Zhuang; Zhou, Yu; Hedrick, James L; Chen, Peng-Cheng; He, Shu; Shahjamali, Mohammad M; Wang, Shunzhi; Zheng, Zijian; Mirkin, Chad A

    2015-10-26

    The concept of using cantilever-free scanning probe arrays as structures that can modulate nanoscale ink flow and composition with light is introduced and evaluated. By utilizing polymer pen arrays with an opaque gold layer surrounding the base of the transparent polymer pyramids, we show that inks with photopolymerizable or isomerizable constituents can be used in conjunction with light channelled through the pyramids to control ink viscosity or composition in a dynamic manner. This on-tip photo-modulated molecular printing provides novel chemically and mechanically controlled approaches to regulating ink transport and composition in real time and could be useful not only for rapidly adjusting feature size but also for studying processes including photoreactions and mass transport at the nanoscale, self-assembly, and cell-material interactions.

  14. Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

    NASA Astrophysics Data System (ADS)

    Pea, M.; Maiolo, L.; Giovine, E.; Rinaldi, A.; Araneo, R.; Notargiacomo, A.

    2016-05-01

    We report on the conductive-atomic force microscopy (C-AFM) study of metallic layers in order to find the most suitable configuration for electrical characterization of individual ZnO micro-pillars fabricated by focused ion beam (FIB). The electrical resistance between the probe tip and both as deposited and FIB processed metal layers (namely, Cr, Ti, Au and Al) has been investigated. Both chromium and titanium evidenced a non homogenous and non ohmic behaviour, non negligible scanning probe induced anodic oxidation associated to electrical measurements, and after FIB milling they exhibited significantly higher tip-sample resistance. Aluminium had generally a more apparent non conductive behaviour. Conversely, gold films showed very good tip-sample conduction properties being less sensitive to FIB processing than the other investigated metals. We found that a reliable C-AFM electrical characterization of ZnO microstructures obtained by FIB machining is feasible by using a combination of metal films as top contact layer. An Au/Ti bilayer on top of ZnO was capable to sustain the FIB fabrication process and to form a suitable ohmic contact to the semiconductor, allowing for reliable C-AFM measurement. To validate the consistency of this approach, we measured the resistance of ZnO micropillars finding a linear dependence on the pillar height, as expected for an ohmic conductor, and evaluated the resistivity of the material. This procedure has the potential to be downscaled to nanometer size structures by a proper choice of metal films type and thickness.

  15. Note: A resonating reflector-based optical system for motion measurement in micro-cantilever arrays

    SciTech Connect

    Sathishkumar, P.; Punyabrahma, P.; Sri Muthu Mrinalini, R.; Jayanth, G. R.

    2015-09-15

    A robust, compact optical measurement unit for motion measurement in micro-cantilever arrays enables development of portable micro-cantilever sensors. This paper reports on an optical beam deflection-based system to measure the deflection of micro-cantilevers in an array that employs a single laser source, a single detector, and a resonating reflector to scan the measurement laser across the array. A strategy is also proposed to extract the deflection of individual cantilevers from the acquired data. The proposed system and measurement strategy are experimentally evaluated and demonstrated to measure motion of multiple cantilevers in an array.

  16. Simultaneous liquid viscosity and density determination with piezoelectric unimorph cantilevers

    NASA Astrophysics Data System (ADS)

    Shih, Wan Y.; Li, Xiaoping; Gu, Huiming; Shih, Wei-Heng; Aksay, Ilhan A.

    2001-01-01

    We have examined both experimentally and theoretically a piezoelectric unimorph cantilever as a liquid viscosity-and-density sensor. The fabricated piezoelectric unimorph consisted of a PbOṡZrO2ṡTiO2 (PZT) layer on a thin stainless-steel plate. In addition to a driving electrode, a sensing electrode was placed on top of the PZT layer, permitting the direct measurement of the resonance frequency. The cantilever was tested using water-glycerol solutions of different compositions. In all three of the tested modes, the resonance frequency decreased while the width of the resonance peak increased with increasing glycerol content. To account for the liquid effect, we consider the cantilever as a sphere of radius R oscillating in a liquid. By including the high and low frequency terms in the induced mass and the damping coefficient of the liquid, we show that for a given liquid density and viscosity the oscillating-sphere model predicts a resonance frequency and peak width that closely agree with experiment. Furthermore, the viscosity and the density of a liquid have been determined simultaneously using the experimentally measured resonance frequency and peak width as inputs to the oscillating-sphere model. The calculated liquid viscosity and density closely agreed with the known values, indicating that our cantilever-based sensor is effective in determining viscosity and density, simultaneously. We also show that scaling analysis predicts an increase in the width of the resonance peak with decreasing cantilever size, an observation in agreement with the large peak widths observed for microcantilevers.

  17. [Application of atomic force microscopy (AFM) in ophthalmology].

    PubMed

    Milka, Michał; Mróz, Iwona; Jastrzebska, Maria; Wrzalik, Roman; Dobrowolski, Dariusz; Roszkowska, Anna M; Moćko, Lucyna; Wylegała, Edward

    2012-01-01

    Atomic force microscopy (AFM) allows to examine surface of different biological objects in the nearly physiological conditions at the nanoscale. The purpose of this work is to present the history of introduction and the potential applications of the AFM in ophthalmology research and clinical practice. In 1986 Binnig built the AFM as a next generation of the scanning tunnelling microscope (STM). The functional principle of AFM is based on the measurement of the forces between atoms on the sample surface and the probe. As a result, the three-dimensional image of the surface with the resolution on the order of nanometres can be obtained. Yamamoto used as the first the AFM on a wide scale in ophthalmology. The first investigations used the AFM method to study structure of collagen fibres of the cornea and of the sclera. Our research involves the analysis of artificial intraocular lenses (IOLs). According to earlier investigations, e.g. Lombardo et al., the AFM was used to study only native IOLs. Contrary to the earlier investigations, we focused our measurements on lenses explanted from human eyes. The surface of such lenses is exposed to the influence of the intraocular aqueous environment, and to the related impacts of biochemical processes. We hereby present the preliminary results of our work in the form of AFM images depicting IOL surface at the nanoscale. The images allowed us to observe early stages of the dye deposit formation as well as local calcinosis. We believe that AFM is a very promising tool for studying the structure of IOL surface and that further observations will make it possible to explain the pathomechanism of artificial intraocular lens opacity formation.

  18. Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe Microscopy

    NASA Astrophysics Data System (ADS)

    Lin, Chun-Ting; Chen, Yu-Wei; Su, James; Wu, Chien-Ting; Hsiao, Chien-Nan; Shiao, Ming-Hua; Chang, Mao-Nan

    2015-10-01

    In this study, we propose an ultra-facile approach to prepare a platinum silicide nanoparticle-modified tip apex (PSM tip) used for scanning Kelvin probe microscopy (SKPM). We combined a localized fluoride-assisted galvanic replacement reaction (LFAGRR) and atmospheric microwave annealing (AMA) to deposit a single platinum silicide nanoparticle with a diameter of 32 nm on the apex of a bare silicon tip of atomic force microscopy (AFM). The total process was completed in an ambient environment in less than 3 min. The improved potential resolution in the SKPM measurement was verified. Moreover, the resolution of the topography is comparable to that of a bare silicon tip. In addition, the negative charges found on the PSM tips suggest the possibility of exploring the use of current PSM tips to sense electric fields more precisely. The ultra-fast and cost-effective preparation of the PSM tips provides a new direction for the preparation of functional tips for scanning probe microscopy.

  19. Structure, cell wall elasticity and polysaccharide properties of living yeast cells, as probed by AFM

    NASA Astrophysics Data System (ADS)

    Alsteens, David; Dupres, Vincent; McEvoy, Kevin; Wildling, Linda; Gruber, Hermann J.; Dufrêne, Yves F.

    2008-09-01

    Although the chemical composition of yeast cell walls is known, the organization, assembly, and interactions of the various macromolecules remain poorly understood. Here, we used in situ atomic force microscopy (AFM) in three different modes to probe the ultrastructure, cell wall elasticity and polymer properties of two brewing yeast strains, i.e. Saccharomyces carlsbergensis and S. cerevisiae. Topographic images of the two strains revealed smooth and homogeneous cell surfaces, and the presence of circular bud scars on dividing cells. Nanomechanical measurements demonstrated that the cell wall elasticity of S. carlsbergensis is homogeneous. By contrast, the bud scar of S. cerevisiae was found to be stiffer than the cell wall, presumably due to the accumulation of chitin. Notably, single molecule force spectroscopy with lectin-modified tips revealed major differences in polysaccharide properties of the two strains. Polysaccharides were clearly more extended on S. cerevisiae, suggesting that not only oligosaccharides, but also polypeptide chains of the mannoproteins were stretched. Consistent with earlier cell surface analyses, these findings may explain the very different aggregation properties of the two organisms. This study demonstrates the power of using multiple complementary AFM modalities for probing the organization and interactions of the various macromolecules of microbial cell walls.

  20. Identifying and quantifying two ligand-binding sites while imaging native human membrane receptors by AFM

    NASA Astrophysics Data System (ADS)

    Pfreundschuh, Moritz; Alsteens, David; Wieneke, Ralph; Zhang, Cheng; Coughlin, Shaun R.; Tampé, Robert; Kobilka, Brian K.; Müller, Daniel J.

    2015-11-01

    A current challenge in life sciences is to image cell membrane receptors while characterizing their specific interactions with various ligands. Addressing this issue has been hampered by the lack of suitable nanoscopic methods. Here we address this challenge and introduce multifunctional high-resolution atomic force microscopy (AFM) to image human protease-activated receptors (PAR1) in the functionally important lipid membrane and to simultaneously localize and quantify their binding to two different ligands. Therefore, we introduce the surface chemistry to bifunctionalize AFM tips with the native receptor-activating peptide and a tris-N-nitrilotriacetic acid (tris-NTA) group binding to a His10-tag engineered to PAR1. We further introduce ways to discern between the binding of both ligands to different receptor sites while imaging native PAR1s. Surface chemistry and nanoscopic method are applicable to a range of biological systems in vitro and in vivo and to concurrently detect and localize multiple ligand-binding sites at single receptor resolution.

  1. Raman and AFM study of gamma irradiated plastic bottle sheets

    NASA Astrophysics Data System (ADS)

    Ali, Yasir; Kumar, Vijay; Sonkawade, R. G.; Dhaliwal, A. S.

    2013-02-01

    In this investigation, the effects of gamma irradiation on the structural properties of plastic bottle sheet are studied. The Plastic sheets were exposed with 1.25MeV 60Co gamma rays source at various dose levels within the range from 0-670 kGy. The induced modifications were followed by micro-Raman and atomic force microscopy (AFM). The Raman spectrum shows the decrease in Raman intensity and formation of unsaturated bonds with an increase in the gamma dose. AFM image displays rough surface morphology after irradiation. The detailed Raman analysis of plastic bottle sheets is presented here, and the results are correlated with the AFM observations.

  2. AFM review study on pox viruses and living cells.

    PubMed

    Ohnesorge, F M; Hörber, J K; Häberle, W; Czerny, C P; Smith, D P; Binnig, G

    1997-10-01

    Single living cells were studied in growth medium by atomic force microscopy at a high--down to one image frame per second--imaging rate over time periods of many hours, stably producing hundreds of consecutive scans with a lateral resolution of approximately 30-40 nm. The cell was held by a micropipette mounted onto the scanner-piezo as shown in Häberle, W., J. K. H. Hörber, and G. Binnig. 1991. Force microscopy on living cells. J. Vac. Sci. Technol. B9:1210-0000. To initiate specific processes on the cell surface the cells had been infected with pox viruses as reported earlier and, most likely, the liberation of a progeny virion by the still-living cell was observed, hence confirming and supporting earlier results (Häberle, W., J. K. H. Hörber, F. Ohnesorge, D. P. E. Smith, and G. Binnig. 1992. In situ investigations of single living cells infected by viruses. Ultramicroscopy. 42-44:1161-0000; Hörber, J. K. H., W. Häberle, F. Ohnesorge, G. Binnig, H. G. Liebich, C. P. Czerny, H. Mahnel, and A. Mayr. 1992. Investigation of living cells in the nanometer regime with the atomic force microscope. Scanning Microscopy. 6:919-930). Furthermore, the pox viruses used were characterized separately by AFM in an aqueous environment down to the molecular level. Quasi-ordered structural details were resolved on a scale of a few nm where, however, image distortions and artifacts due to multiple tip effects are probably involved--just as in very high resolution (<15-20 nm) images on the cells. Although in a very preliminary manner, initial studies on the mechanical resonance properties of a single living (noninfected) cell, held by the micropipette, have been performed. In particular, frequency response spectra were recorded that indicate elastic properties and enough stiffness of these cells to make the demonstrated rapid scanning of the imaging tip plausible. Measurements of this kind, especially if they can be proven to be cell-type specific, may perhaps have a large

  3. Mechano-chemical manipulation of Sn chains on Si(1 0 0) by NC-AFM.

    PubMed

    Sweetman, A; Lekkas, I; Moriarty, P

    2017-02-22

    We investigate the atomic structure of Sn dimer chains grown on the Si(1 0 0) surface using non-contact atomic force microscopy (NC-AFM) at cryogenic temperatures. We find that similar to the native Si(1 0 0) dimer structure, the ground state of the Sn dimer structure is buckled at low temperature. At 5 K we show that the buckling state of the Sn dimers may be controllably, and reversibly, manipulated with atomic precision by close approach of the tip, without modification of the underlying substrate buckling structure. At intermediate cryogenic temperatures we observe changes in the configuration of the dimer chains in the region where the tip-sample interaction is very weak, suggesting that the energy barrier to transit between configurations is sufficiently small to be surmounted at 78 K.

  4. Mechano-chemical manipulation of Sn chains on Si(1 0 0) by NC-AFM

    NASA Astrophysics Data System (ADS)

    Sweetman, A.; Lekkas, I.; Moriarty, P.

    2017-02-01

    We investigate the atomic structure of Sn dimer chains grown on the Si(1 0 0) surface using non-contact atomic force microscopy (NC-AFM) at cryogenic temperatures. We find that similar to the native Si(1 0 0) dimer structure, the ground state of the Sn dimer structure is buckled at low temperature. At 5 K we show that the buckling state of the Sn dimers may be controllably, and reversibly, manipulated with atomic precision by close approach of the tip, without modification of the underlying substrate buckling structure. At intermediate cryogenic temperatures we observe changes in the configuration of the dimer chains in the region where the tip-sample interaction is very weak, suggesting that the energy barrier to transit between configurations is sufficiently small to be surmounted at 78 K.

  5. The Electric Field of CO Tips and Its Relevance for Atomic Force Microscopy.

    PubMed

    Ellner, Michael; Pavliček, Niko; Pou, Pablo; Schuler, Bruno; Moll, Nikolaj; Meyer, Gerhard; Gross, Leo; Peréz, Rubén

    2016-03-09

    Metal tips decorated with CO molecules have paved the way for an impressively high resolution in atomic force microscopy (AFM). Although Pauli repulsion and the associated CO tilting play a dominant role at short distances, experiments on polar and metallic systems show that electrostatic interactions are necessary to understand the complex contrast observed and its distance evolution. Attempts to describe those interactions in terms of a single electrostatic dipole replacing the tip have led to contradictory statements about its nature and strength. Here, we solve this puzzle with a comprehensive experimental and theoretical characterization of the AFM contrast on Cl vacancies. Our model, based on density functional theory (DFT) calculations, reproduces the complex evolution of the contrast between both the Na cation and Cl anion sites, and the positively charged vacancy as a function of tip height, and highlights the key contribution of electrostatic interactions for tip-sample distances larger than 500 pm. For smaller separations, Pauli repulsion and the associated CO tilting start to dominate the contrast. The electrostatic field of the CO-metal tip can be represented by the superposition of the fields from the metal tip and the CO molecule. The long-range behavior is defined by the metal tip that contributes the field of a dipole with its positive pole at the apex. At short-range, the CO exhibits an opposite field that prevails. The interplay of these fields, with opposite sign and rather different spatial extension, is crucial to describe the contrast evolution as a function of the tip height.

  6. Removing material using atomic force microscopy with single- and multiple-tip sources.

    PubMed

    Tseng, Ampere A

    2011-12-16

    Atomic force microscopy (AFM) has been an effective material removing tool for fabricating various nanostructures because of its sub-nanometer precision and simplicity in operation. AFM material removing techniques have evolved from a solely mechanical process to one in which the tip can be loaded by additional energy sources, such as thermal, electric, or chemical, to enhance its fabrication abilities. In this paper, these material removing techniques are reviewed with an emphasis on their capabilities and recent progress. The recent hardware and software developments are first presented to provide a general view on the current status of the technology to be assessed. Following an overview of the feasibility and effectiveness of using mechanical scratching for removing various types of soft and hard materials, the processes of a wide range of approaches using multiple tip sources are then assessed with a focus on their principles, versatilities, and potentials for future applications.

  7. Tip relaxation in atomic force microscopy imaging simulations to resolve intermolecular bonds

    NASA Astrophysics Data System (ADS)

    Lee, Alex; Sakai, Yuki; Chelikowsky, Jim

    Experimental noncontact atomic force microscopy (AFM) studies have reported distinct lines in regions with no electron density for a variety of systems. The appearance of these lines is unexpected because Pauli repulsion is thought to be the dominant factor in the AFM imaging mechanism. These lines have been proposed to represent intermolecular bonding. Recent theoretical studies have shown that accounting for tip probe relaxation can sharpen images and highlight features that make simulations more comparable to experiment. We will apply a similar tip relaxation scheme to our computational method-which uses an ab initio real-space pseudopotential formalism with frozen density embedding theory added-to the study of dibenzo[a,h]thianthrene and an 8-hydroxyquinoline dimer to develop our interpretation of imaged intermolecular bonds. Work is supported by the DOE under DOE/DE-FG02-06ER46286 and by the Welch Foundation under Grant F-1837. Computational resources were provided by NERSC and XSEDE.

  8. Bending and shear stresses developed by the instantaneous arrest of the root of a cantilever beam rotating with constant angular velocity about a transverse axis through the root

    NASA Technical Reports Server (NTRS)

    Stowell, Elbridge Z; Schwartz, Edward B; Houbolt, John C

    1945-01-01

    A theoretical investigation was made of the behavior of a cantilever beam in rotational motion about a transverse axis through the root determining the stresses, the deflections, and the accelerations that occur in the beam as a result of the arrest of motion. The equations for bending and shear stress reveal that, at a given percentage of the distance from root to tip and at a given trip velocity, the bending stresses for a particular mode are independent of the length of the beam and the shear stresses vary inversely with the length. When examined with respect to a given angular velocity instead of a given tip velocity, the equations reveal that the bending stress is proportional to the length of the beam whereas the shear stress is independent of the length. Sufficient experimental verification of the theory has previously been given in connection with another problem of the same type.

  9. Examination of Humidity Effects on Measured Thickness and Interfacial Phenomena of Exfoliated Graphene on SiO2 via AC-AFM

    NASA Astrophysics Data System (ADS)

    Jinkins, Katherine; Camacho, Jorge; Farina, Lee; Wu, Yan

    2015-03-01

    Tapping (AC) mode Atomic Force Microscopy (AFM) is commonly used to determine the thickness of graphene samples. However, AFM measurements have been shown to be sensitive to environmental conditions such as adsorbed water, in turn dependent on relative humidity (RH). In the present study, AC-AFM is used to measure the thickness and loss tangent of exfoliated graphene on silicon dioxide (SiO2) as RH is increased from 10% to 80%. We show that the measured thickness of graphene is dependent on RH. Loss tangent is an AFM imaging technique that interprets the phase information as a relationship between the stored and dissipated energy in the tip-sample interaction. This study demonstrates the loss tangent of the graphene and oxide regions are both affected by humidity, with generally higher loss tangent for graphene than SiO2. As RH increases, we observe the loss tangent of both materials approaches the same value. We hypothesize that there is a layer of water trapped between the graphene and SiO2 substrate to explain this observation. Using this interpretation, the loss tangent images also indicate movement and change in this trapped water layer as RH increases, which impacts the measured thickness of graphene using AC-AFM.

  10. Introduction to atomic force microscopy (AFM) in biology.

    PubMed

    Goldsbury, Claire S; Scheuring, Simon; Kreplak, Laurent

    2009-11-01

    The atomic force microscope (AFM) has the unique capability of imaging biological samples with molecular resolution in buffer solution. In addition to providing topographical images of surfaces with nanometer- to angstrom-scale resolution, forces between single molecules and mechanical properties of biological samples can be investigated from the nanoscale to the microscale. Importantly, the measurements are made in buffer solutions, allowing biological samples to "stay alive" within a physiological-like environment while temporal changes in structure are measured-e.g., before and after addition of chemical reagents. These qualities distinguish AFM from conventional imaging techniques of comparable resolution, e.g., electron microscopy (EM). This unit provides an introduction to AFM on biological systems and describes specific examples of AFM on proteins, cells, and tissues. The physical principles of the technique and methodological aspects of its practical use and applications are also described.

  11. Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

    PubMed Central

    Kress, Marina; Wagner, Andreas; Schimmel, Thomas

    2012-01-01

    Summary We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposition. Here, we demonstrate the reversibility of this process and study the long-term stability of the resulting metallic structures. The remarkable stability for more than 1.5 years under ambient air without any observable changes can be attributed to self-passivation. After AFM-activated electrochemical deposition of copper nanostructures on a polycrystalline gold film and subsequent AFM imaging, the copper nanostructures could be dissolved by reversing the electrochemical potential. Subsequent AFM-tip-activated deposition of different copper nanostructures at the same location where the previous structures were deleted, shows that there is no observable memory effect, i.e., no effect of the previous writing process on the subsequent writing process. Thus, the four processes required for reversible information storage, “write”, “read”, “delete” and “re-write”, were successfully demonstrated on the nanometer scale. PMID:23365795

  12. Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging

    NASA Astrophysics Data System (ADS)

    Nellist, Michael R.; Chen, Yikai; Mark, Andreas; Gödrich, Sebastian; Stelling, Christian; Jiang, Jingjing; Poddar, Rakesh; Li, Chunzeng; Kumar, Ravi; Papastavrou, Georg; Retsch, Markus; Brunschwig, Bruce S.; Huang, Zhuangqun; Xiang, Chengxiang; Boettcher, Shannon W.

    2017-03-01

    Multimodal nano-imaging in electrochemical environments is important across many areas of science and technology. Here, scanning electrochemical microscopy (SECM) using an atomic force microscope (AFM) platform with a nanoelectrode probe is reported. In combination with PeakForce tapping AFM mode, the simultaneous characterization of surface topography, quantitative nanomechanics, nanoelectronic properties, and electrochemical activity is demonstrated. The nanoelectrode probe is coated with dielectric materials and has an exposed conical Pt tip apex of ∼200 nm in height and of ∼25 nm in end-tip radius. These characteristic dimensions permit sub-100 nm spatial resolution for electrochemical imaging. With this nanoelectrode probe we have extended AFM-based nanoelectrical measurements to liquid environments. Experimental data and numerical simulations are used to understand the response of the nanoelectrode probe. With PeakForce SECM, we successfully characterized a surface defect on a highly-oriented pyrolytic graphite electrode showing correlated topographical, electrochemical and nanomechanical information at the highest AFM-SECM resolution. The SECM nanoelectrode also enabled the measurement of heterogeneous electrical conductivity of electrode surfaces in liquid. These studies extend the basic understanding of heterogeneity on graphite/graphene surfaces for electrochemical applications.

  13. Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging.

    PubMed

    Nellist, Michael R; Chen, Yikai; Mark, Andreas; Gödrich, Sebastian; Stelling, Christian; Jiang, Jingjing; Poddar, Rakesh; Li, Chunzeng; Kumar, Ravi; Papastavrou, Georg; Retsch, Markus; Brunschwig, Bruce S; Huang, Zhuangqun; Xiang, Chengxiang; Boettcher, Shannon W

    2017-03-03

    Multimodal nano-imaging in electrochemical environments is important across many areas of science and technology. Here, scanning electrochemical microscopy (SECM) using an atomic force microscope (AFM) platform with a nanoelectrode probe is reported. In combination with PeakForce tapping AFM mode, the simultaneous characterization of surface topography, quantitative nanomechanics, nanoelectronic properties, and electrochemical activity is demonstrated. The nanoelectrode probe is coated with dielectric materials and has an exposed conical Pt tip apex of ∼200 nm in height and of ∼25 nm in end-tip radius. These characteristic dimensions permit sub-100 nm spatial resolution for electrochemical imaging. With this nanoelectrode probe we have extended AFM-based nanoelectrical measurements to liquid environments. Experimental data and numerical simulations are used to understand the response of the nanoelectrode probe. With PeakForce SECM, we successfully characterized a surface defect on a highly-oriented pyrolytic graphite electrode showing correlated topographical, electrochemical and nanomechanical information at the highest AFM-SECM resolution. The SECM nanoelectrode also enabled the measurement of heterogeneous electrical conductivity of electrode surfaces in liquid. These studies extend the basic understanding of heterogeneity on graphite/graphene surfaces for electrochemical applications.

  14. Stabilized atomic force microscopy imaging in liquids using second harmonic of cantilever motion for setpoint control

    NASA Astrophysics Data System (ADS)

    Schiener, Jens; Witt, Susanne; Stark, Martin; Guckenberger, Reinhard

    2004-08-01

    We present an automated stabilization of the imaging process in tapping mode atomic force microscopy. For biological applications, the requirement of stable imaging conditions to achieve reliable high resolution is contradicted by the necessity to work in solution to ensure biological functionality: thermal and saline variations of the viscosity, in particular when exchanging the solution the sample is surrounded with, strongly affect the cantilever motion rendering the imaging process instable. Using anharmonic contributions in the deflection signal, the amplitude setpoint is controlled to compensate for unavoidable drift in the free oscillation. By this additional feedback, the tip-sample interaction is maintained stable at a low value, making the instrument robust against drift and tolerant to environmental changes. As a delicate test sample, the "single ring"-mutant of the bacterial chaperonin GroEL from E. coli was imaged. To prove the efficiency of our setup, we show highly stabilized, continuous imaging with minimized user interaction while strong perturbations by exchange of the buffer solution were imposed during the scanning.

  15. A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

    NASA Astrophysics Data System (ADS)

    Zhao, Xuezeng; Vorburger, Theodore V.; Fu, Joseph; Song, John; Nguyen, Cattien V.

    2003-09-01

    Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro-mechanical engineering. With the development of manufacturing technology in recent years, the sizes of linewidths are steadily shrinking and are in the range of hundreds of nanometers. As a result, it is difficult to achieve accurate measurement results for nanometer scale linewidth, primarily because of the interaction volume of electrons in materials for an SEM probe or the tip size of an AFM probe. However, another source of methods divergence is the mathematical model of the line itself. In order to reduce the methods divergences caused by different measurement methods and instruments for an accurate determination of nanometer scale linewidth parameters, a metrological model and algorithm are proposed for linewidth measurements with AFM. The line profile is divided into 5 parts with 19 sections and 20 key derived points. Each section is fitted by a least squares straight line, so that the profile can be represented by a set of straight lines and 6 special points, or by a 20×2 matrix of fitted points and a 6×2 matrix of starter points. According to the algorithm, WT and WTF, WM and WMF, WB and WBF represent the widths at the top, the middle and the bottom of the line profile before and after the least squares fitting, respectively. AL and AR represent the left and right sidewall angles, and H represents the step height of the line profile. Based on this algorithm, software has been developed using MATLAB for the calculation of width and height parameters of the line profile. A NIST nanometer scale linewidth artifact developed at NIST's Electronics and Electrical Engineering Laboratory (EEEL) was measured using a commercial AFM with nanotube tips. The measured linewidth profiles are analyzed using our model, algorithm and software. The model developed in this paper is straightforward to understand, and

  16. Label-free detection of kanamycin using aptamer-based cantilever array sensor.

    PubMed

    Bai, Xiaojing; Hou, Hui; Zhang, Bailin; Tang, Jilin

    2014-06-15

    A label-free detection method of kanamycin using aptamer-based cantilever array sensor was developed. The cantilever array was composed of sensing cantilevers and reference cantilevers. This configuration allowed direct detection of individual cantilever deflections and subsequent determination of differential deflection of sensing/reference cantilever pair. The sensing cantilevers were functionalized with kanamycin aptamer, which was used as receptor molecules while the reference cantilevers were modified with 6-mercapto-1-hexanol (MCH) to eliminate the influence of environmental disturbances. The kanamycin-aptamer interaction induced a change in cantilever surface stress, which caused a differential deflection between the sensing and reference cantilever pair. The surface stress change was linear with kanamycin concentration over the range of 100 μM-10mM with a correlation coefficient of 0.995. A detection limit of 50 μM was obtained, at a signal-to-noise ratio of 3. The sensor also showed good selectivity against other antibiotics such as neomycin, ribostamycin and chloramphenicol. The facile method for kanamycin detection may have great potential for investigating more other molecules.

  17. Computer Simulation of the Forces Acting on the Polystyrene Probe Submerged into the Succinonitrile Near Phase Transition

    NASA Technical Reports Server (NTRS)

    Bune, Andris V.; Kaukler, William F.; Whitaker, Ann F. (Technical Monitor)

    2001-01-01

    Modeling approach to simulate both mesoscale and microscopic forces acting in a typical AFM experiment is presented. At mesoscale level interaction between the cantilever tip and the sample surface is primarily described by the balance of attractive Van der Waals and repulsive forces. The model of cantilever oscillations is applicable to both non-contact and "tapping" AFM. This model can be farther enhanced to describe nanoparticle manipulation by cantilever. At microscopic level tip contamination and details of tip-surface interaction can be simulated using molecular dynamics approach. Integration of mesoscale model with molecular dynamic model is discussed.

  18. Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes

    DOEpatents

    Hsu, Wei-Chun; Tong, Jonathan Kien-Kwok; Liao, Bolin; Chen, Gang

    2015-04-21

    A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.

  19. Vibrations of cantilevered shallow cylindrical shells of rectangular planform

    NASA Technical Reports Server (NTRS)

    Leissa, A. W.; Lee, J. K.; Wang, A. J.

    1981-01-01

    A cantilevered, shallow shell of circular cylindrical curvature and rectangular planform exhibits free vibration behavior which differs considerably from that of a cantilevered beam or of a flat plate. Some numerical results can be found for the problem in the previously published literature, mainly obtained by using various finite element methods. The present paper is the first definitive study of the problem, presenting accurate non-dimensional frequency parameters for wide ranges of aspect ratio, shallowness ratio and thickness ratio. The analysis is based upon shallow shell theory. Numerical results are obtained by using the Ritz method, with algebraic polynomial trial functions for the displacements. Convergence is investigated, with attention being given both to the number of terms taken for each co-ordinate direction and for each of the three components of displacement. Accuracy of the results is also established by comparison with finite element results for shallow shells and with other accurate flat plate solutions.

  20. Controlled generation of intrinsic localized modes in microelectromechanical cantilever arrays

    NASA Astrophysics Data System (ADS)

    Chen, Qingfei; Lai, Ying-Cheng; Dietz, David

    2010-12-01

    We propose a scheme to induce intrinsic localized modes (ILMs) at an arbitrary site in microelectromechanical cantilever arrays. The idea is to locate the particular cantilever beam in the array that one wishes to drive to an oscillating state with significantly higher amplitude than the average and then apply small adjustments to the electrical signal that drives the whole array system. Our scheme is thus a global closed-loop control strategy. We argue that the dynamical mechanism on which our global driving scheme relies is spatiotemporal chaos and we develop a detailed analysis based on the standard averaging method in nonlinear dynamics to understand the working of our control scheme. We also develop a Markov model to characterize the transient time required for inducing ILMs.

  1. Laser Actuation of Cantilevers for Picometre Amplitude Dynamic Force Microscopy

    PubMed Central

    Evans, Drew R.; Tayati, Ponlawat; An, Hongjie; Lam, Ping Koy; Craig, Vincent S. J.; Senden, Tim J.

    2014-01-01

    As nanoscale and molecular devices become reality, the ability to probe materials on these scales is increasing in importance. To address this, we have developed a dynamic force microscopy technique where the flexure of the microcantilever is excited using an intensity modulated laser beam to achieve modulation on the picoscale. The flexure arises from thermally induced bending through differential expansion and the conservation of momentum when the photons are reflected and absorbed by the cantilever. In this study, we investigated the photothermal and photon pressure responses of monolithic and layered cantilevers using a modulated laser in air and immersed in water. The developed photon actuation technique is applied to the stretching of single polymer chains. PMID:24993548

  2. Sacrificial layer for the fabrication of electroformed cantilevered LIGA microparts

    NASA Astrophysics Data System (ADS)

    Morales, Alfredo M.; Aigeldinger, Georg; Bankert, Michelle A.; Domeier, Linda A.; Hachman, John T.; Hauck, Cheryl; Keifer, Patrick N.; Krafcik, Karen L.; McLean, Dorrance E.; Yang, Peter C.

    2003-01-01

    The use of silver filled PMMA as a sacrificial layer for the fabrication of multilevel LIGA microparts is presented. In this technique, a bottom level of standard electroformed LIGA parts is first produced on a metallized substrate such as a silicon wafer. A methyl methacrylate formulation mixed with silver particles is then cast and polymerized around the bottom level of metal parts to produce a conducting sacrificial layer. A second level of PMMA x-ray resist is adhered to the bottom level of metal parts and conducting PMMA and patterned to form another level of electroformed features. This presentation will discuss some the requirements for the successful fabrication of multilevel, cantilevered LIGA microparts. It will be shown that by using a silver filled PMMA, a sacrificial layer can be quickly applied around LIGA components; cantilevered microparts can be electroformed; and the final parts can be quickly released by dissolving the sacrificial layer in acetone.

  3. Vibrations of cantilevered shallow cylindrical shells of rectangular planform

    NASA Astrophysics Data System (ADS)

    Leissa, A. W.; Lee, J. K.; Wang, A. J.

    1981-10-01

    A cantilevered, shallow shell of circular cylindrical curvature and rectangular planform exhibits free vibration behavior which differs considerably from that of a cantilevered beam or of a flat plate. Some numerical results can be found for the problem in the previously published literature, mainly obtained by using various finite element methods. The present paper is the first definitive study of the problem, presenting accurate non-dimensional frequency parameters for wide ranges of aspect ratio, shallowness ratio and thickness ratio. The analysis is based upon shallow shell theory. Numerical results are obtained by using the Ritz method, with algebraic polynomial trial functions for the displacements. Convergence is investigated, with attention being given both to the number of terms taken for each co-ordinate direction and for each of the three components of displacement. Accuracy of the results is also established by comparison with finite element results for shallow shells and with other accurate flat plate solutions.

  4. An intelligent control scheme for precise tip-motion control in atomic force microscopy.

    PubMed

    Wang, Yanyan; Hu, Xiaodong; Xu, Linyan

    2016-01-01

    The paper proposes a new intelligent control method to precisely control the tip motion of the atomic force microscopy (AFM). The tip moves up and down at a high rate along the z direction during scanning, requiring the utilization of a rapid feedback controller. The standard proportional-integral (PI) feedback controller is commonly used in commercial AFMs to enable topography measurements. The controller's response performance is determined by the set of the proportional (P) parameter and the integral (I) parameter. However, the two parameters cannot be automatically altered simultaneously according to the scanning speed and the surface topography during continuors scanning, leading to an inaccurate measurement. Thus a new intelligent controller combining the fuzzy controller and the PI controller is put forward in the paper. The new controller automatically selects the most appropriate PI parameters to achieve a fast response rate on basis of the tracking errors. In the experimental setup, the new controller is realized with a digital signal process (DSP) system, implemented in a conventional AFM system. Experiments are carried out by comparing the new method with the standard PI controller. The results demonstrate that the new method is more robust and effective for the precise tip motion control, corresponding to the achievement of a highly qualified image by shortening the response time of the controller.

  5. Automatic Optical Crack Tracking for Double Cantilever Beam Specimens

    DTIC Science & Technology

    2015-01-01

    TECHN ICAL ART IC LE Automatic Optical Crack Tracking for Double Cantilever Beam Specimens B. Krull1,2, J. Patrick2,3, K. Hart2,4, S. White2,4, and N...computer program with edge detection software rapidly, automatically, and accurately tracks the crack front in translucent DCB specimens by optically ...through the DCB, crack length is optically determined from hand-marked delineations along the profile (side) of each sample. Continuous crack length

  6. Frequency Response of Nanoelectromechanical Cantilevers Operating in Fluid

    DTIC Science & Technology

    2008-08-01

    losses. These losses can be computed using the Navier - Stokes equations on the cantilever cross- section. [9]- [12] Navier - Stokes solvers have been...frequency ω: )sin()( tFtF o ω= . (8) The viscous drag force is computed by solving the time- dependent Navier - Stokes ...Solution of the velocity and pressure using a time- dependent Navier - Stokes algorithm. 2. Computation of the fluid force, spring force, and

  7. Accurate Method for Determining Adhesion of Cantilever Beams

    SciTech Connect

    Michalske, T.A.; de Boer, M.P.

    1999-01-08

    Using surface micromachined samples, we demonstrate the accurate measurement of cantilever beam adhesion by using test structures which are adhered over long attachment lengths. We show that this configuration has a deep energy well, such that a fracture equilibrium is easily reached. When compared to the commonly used method of determining the shortest attached beam, the present method is much less sensitive to variations in surface topography or to details of capillary drying.

  8. Apertureless cantilever-free pen arrays for scanning photochemical printing.

    PubMed

    Zhou, Yu; Xie, Zhuang; Brown, Keith A; Park, Daniel J; Zhou, Xiaozhu; Chen, Peng-Cheng; Hirtz, Michael; Lin, Qing-Yuan; Dravid, Vinayak P; Schatz, George C; Zheng, Zijian; Mirkin, Chad A

    2015-02-25

    A novel, apertureless, cantilever-free pen array can be used for dual scanning photochemical and molecular printing. Serial writing with light is enabled by combining self-focusing pyramidal pens with an opaque backing between pens. The elastomeric pens also afford force-tuned illumination and simultaneous delivery of materials and optical energy. These attributes make the technique a promising candidate for maskless high-resolution photopatterning and combinatorial chemistry.

  9. Carbon nanotube cantilevers on self-aligned copper silicide nanobeams

    NASA Astrophysics Data System (ADS)

    Parajuli, Omkar; Kumar, Nitin; Kipp, Dylan; Hahm, Jong-in

    2007-04-01

    In this letter, the authors describe both a growth method for self-aligning copper silicide (Cu3Si) nanobeams and their use as active catalysts for carbon nanotube (CNT) synthesis via chemical vapor deposition. In the unique geometry of these useful structures, CNT cantilevers are anchored firmly to the Cu3Si nanobeams. The resulting CNT-Cu3Si structures may improve accuracy and reliability of CNT applications in nanoelectromechanical systems.

  10. Optical fiber accelerometer based on a silicon micromachined cantilever

    NASA Astrophysics Data System (ADS)

    Malki, Abdelrafik; Lecoy, Pierre; Marty, Jeanine; Renouf, Christine; Ferdinand, Pierre

    1995-12-01

    An intensity-modulated fiber-optic accelerometer based on backreflection effects has been manufactured and tested. It uses a multimode fiber placed at a spherical mirror center, and the beam intensity is modulated by a micromachined silicon cantilever. This device has applications as an accelerometer and vibrometer for rotating machines. It exhibits an amplitude linearity of +/-1.2% in the range of 0.1-22 m s-2, a frequency linearity of +/-1% in the

  11. Direct Measurement of Lateral Force Using Dual Cantilevers

    PubMed Central

    Ishikawa, Makoto; Ichikawa, Masaya; Miura, Kouji

    2012-01-01

    We have constructed an experimental system to measure a piconewton lateral force using dual cantilevers which cross with each other. The resolution of the lateral force is estimated to be 3.3 p ± 0.2 pN, which is comparable to forces due to thermal fluctuation. This experimental apparatus works so easily that it will enable us to determine forces during nano-manipulation and nano-tribological measurements. PMID:22737001

  12. Gas only nozzle fuel tip

    DOEpatents

    Bechtel, William Theodore; Fitts, David Orus; DeLeonardo, Guy Wayne

    2002-01-01

    A diffusion flame nozzle gas tip is provided to convert a dual fuel nozzle to a gas only nozzle. The nozzle tip diverts compressor discharge air from the passage feeding the diffusion nozzle air swirl vanes to a region vacated by removal of the dual fuel components, so that the diverted compressor discharge air can flow to and through effusion holes in the end cap plate of the nozzle tip. In a preferred embodiment, the nozzle gas tip defines a cavity for receiving the compressor discharge air from a peripheral passage of the nozzle for flow through the effusion openings defined in the end cap plate.

  13. SU8 diaphragm micropump with monolithically integrated cantilever check valves.

    PubMed

    Ezkerra, Aitor; Fernández, Luis José; Mayora, Kepa; Ruano-López, Jesús Miguel

    2011-10-07

    This paper presents a SU8 unidirectional diaphragm micropump with embedded out-of-plane cantilever check valves. The device represents a reliable and low-cost solution for integration of microfluidic control in lab-on-a-chip devices. Its planar architecture allows monolithic definition of its components in a single step and potential integration with previously reported PCR, electrophoresis and flow-sensing SU8 microdevices. Pneumatic actuation is applied on a PDMS diaphragm, which is bonded to the SU8 body at wafer level, further enhancing its integration and mass production capabilities. The cantilever check valves move synchronously with the diaphragm, feature fast response (10ms), low dead volume (86nl) and a 94% flow blockage up to 300kPa. The micropump achieves a maximum flow rate of 177 μl min(-1) at 6 Hz and 200 kPa with an effective area of 10 mm(2). The device is reliable, self-priming and tolerant to particles and big bubbles. To the knowledge of the authors, this is the first micropump in SU8 with monolithically integrated cantilever check valves.

  14. Vibration analysis of magnetostrictive thin-film composite cantilever actuator

    NASA Astrophysics Data System (ADS)

    Xu, Yan; Shang, Xinchun

    2016-09-01

    The transverse vibration of a composed cantilever beam with magnetostrictive layer is analyzed, which is employed to simulate dynamic response of an actuator. The high-order shear deformation theory of beam and the coupling magnetoelastic constitutive relationship are introduced to construct the governing equations, all interface conditions between magnetostrictive film and elastic substrate as well as the free stress condition on the top and bottom surfaces of the beam can be satisfied. In order to demonstrate validity of the presented mathematical modeling, the verification examples are also given. Furthermore, the effect of geometry and material parameters on dynamic characteristics of magnetostrictive cantilever beam, such as the nature frequency and amplitude, is discussed. Moreover, through computing the magneto-mechanical coupling factor of the beam structure, the variation tendency curves of the factor along with different parameters and frequencies of magnetostrictive cantilever beam actuator have been presented. These numerical results should be useful for the design of beam-type with magnetostrictive thin-film actuators.

  15. A cantilever-free approach to dot-matrix nanoprinting

    PubMed Central

    Brown, Keith A.; Eichelsdoerfer, Daniel J.; Shim, Wooyoung; Rasin, Boris; Radha, Boya; Liao, Xing; Schmucker, Abrin L.; Liu, Guoliang; Mirkin, Chad A.

    2013-01-01

    Scanning probe lithography (SPL) is a promising candidate approach for desktop nanofabrication, but trade-offs in throughput, cost, and resolution have limited its application. The recent development of cantilever-free scanning probe arrays has allowed researchers to define nanoscale patterns in a low-cost and high-resolution format, but with the limitation that these are duplication tools where each probe in the array creates a copy of a single pattern. Here, we report a cantilever-free SPL architecture that can generate 100 nanometer-scale molecular features using a 2D array of independently actuated probes. To physically actuate a probe, local heating is used to thermally expand the elastomeric film beneath a single probe, bringing it into contact with the patterning surface. Not only is this architecture simple and scalable, but it addresses fundamental limitations of 2D SPL by allowing one to compensate for unavoidable imperfections in the system. This cantilever-free dot-matrix nanoprinting will enable the construction of surfaces with chemical functionality that is tuned across the nano- and macroscales. PMID:23861495

  16. Polymeric cantilever integrated with PDMS/graphene composite strain sensor.

    PubMed

    Choi, Young-Soo; Gwak, Min-Joo; Lee, Dong-Weon

    2016-10-01

    This paper describes the mechanical and electrical characteristics of a polydimethylsiloxane (PDMS) cantilever integrated with a high-sensitivity strain sensor. The strain sensor is fabricated using PDMS and graphene flakes that are uniformly distributed in the PDMS. In order to prepare PDMS/graphene composite with uniform resistance, a tetrahydrofuran solution is used to decrease the viscosity of a PDMS base polymer solution. A horn-type sonicator is then used to mix the base polymer with graphene flakes. Low viscosity of the base polymer solution improves the reliability and reproducibility of the PDMS/graphene composite for strain sensor applications. After dicing the composite into the desired sensor shape, a tensile test is performed. The experimental results show that the composite with a concentration of 30 wt.% exhibits a linear response up to a strain rate of 9%. The graphene concentration of the prepared materials affects the gauge factor, which at 20% graphene concentration reaches about 50, and with increasing graphene concentration to 30% decreases to 9. Furthermore, photolithography, PDMS casting, and a stencil process are used to fabricate a PDMS cantilever with an integrated strain sensor. The change in resistance of the integrated PDMS/graphene sensor is characterized with respect to the displacement of the cantilever of within 500 μm. The experimental results confirmed that the prepared PDMS/graphene based sensor has the potential for high-sensitive biosensor applications.

  17. Vibrating cantilever beam in a flowing soap film

    NASA Astrophysics Data System (ADS)

    Sajjanapu, Veera; Ward, Thomas

    2016-11-01

    We present an experimental study of the interaction between a flexible cantilever beam and a flowing fluid medium using a soap film. The vertically falling soap film is capable of attaining speeds ranging from 1.5 - 3 m/s with an operating test section width of 7.5 cm. Experiments were conducted for flexible cantilever beams of length L <= 10 mm yielding Reynolds number 5000 < Re < 10000 and of cantilever beam thickness ranging from 0.03 - 0.08 mm were placed at angles of attack ranging from 10° - 50°. We visualize the beam displacements and wake with a high-speed camera. Assuming small vibrational amplitudes, we consider the Euler-Bernoulli beam theory to understand the dynamics. From the analysis we find that the normalized average displacement is linear with respect to the square of the free-stream velocity. The vibrational amplitude is also discussed using a similar scaling. Finally, visualization of the downstream vortex structure is related to a beams displacement and vibrational frequency using dimensional analysis.

  18. Polymeric cantilever integrated with PDMS/graphene composite strain sensor

    NASA Astrophysics Data System (ADS)

    Choi, Young-Soo; Gwak, Min-Joo; Lee, Dong-Weon

    2016-10-01

    This paper describes the mechanical and electrical characteristics of a polydimethylsiloxane (PDMS) cantilever integrated with a high-sensitivity strain sensor. The strain sensor is fabricated using PDMS and graphene flakes that are uniformly distributed in the PDMS. In order to prepare PDMS/graphene composite with uniform resistance, a tetrahydrofuran solution is used to decrease the viscosity of a PDMS base polymer solution. A horn-type sonicator is then used to mix the base polymer with graphene flakes. Low viscosity of the base polymer solution improves the reliability and reproducibility of the PDMS/graphene composite for strain sensor applications. After dicing the composite into the desired sensor shape, a tensile test is performed. The experimental results show that the composite with a concentration of 30 wt.% exhibits a linear response up to a strain rate of 9%. The graphene concentration of the prepared materials affects the gauge factor, which at 20% graphene concentration reaches about 50, and with increasing graphene concentration to 30% decreases to 9. Furthermore, photolithography, PDMS casting, and a stencil process are used to fabricate a PDMS cantilever with an integrated strain sensor. The change in resistance of the integrated PDMS/graphene sensor is characterized with respect to the displacement of the cantilever of within 500 μm. The experimental results confirmed that the prepared PDMS/graphene based sensor has the potential for high-sensitive biosensor applications.

  19. AFM-based study of fullerenol (C60(OH)24)-induced changes of elasticity in living SMCC-7721 cells.

    PubMed

    Liu, Yang; Wang, Zuobin; Wang, Xinyue

    2015-05-01

    In this study, the alterations of the morphology and biomechanical properties of living SMCC-7721 cancer cells treated with fullerenol (C60(OH)24) for 24, 48, and 72h were investigated using an atomic force microscope (AFM). Comparative analyses show that the elastic moduli of the SMCC-7721 cells exposed to fullerenol decrease significantly with the increase of the treatment periods. Furthermore, in different phases of the treatment, a global decrease in elasticity is accompanied by cellular morphological changes, and the time-dependent effect of the fullerenol can be observed using AFM and optical microscope. In addition, as the treatment duration increases, the indentation force and depth penetrated into the cell membrane by the AFM tip are in a declining trend. The reduction in the stiffness of the cells exposed to fullerenol could be associated with the disruption of the cellular cytoskeleton network. The investigation indicates that the elastic modulus of single living cells can be a useful biomarker to evaluate the effects of fullerenol or other anticancer agents on the cells and reveal instructive information for cellular dynamic behaviors.

  20. Investigations on antibody binding to a micro-cantilever coated with a BAM pesticide residue

    NASA Astrophysics Data System (ADS)

    Bache, Michael; Taboryski, Rafael; Schmid, Silvan; Aamand, Jens; Jakobsen, Mogens Havsteen

    2011-05-01

    The attachment of an antibody to an antigen-coated cantilever has been investigated by repeated experiments, using a cantilever-based detection system by Cantion A/S. The stress induced by the binding of a pesticide residue BAM (2,6 dichlorobenzamide) immobilized on a cantilever surface to anti-BAM antibody is measured using the CantiLab4© system from Cantion A/S with four gold-coated cantilevers and piezo resistive readout. The detection mechanism is in principle label-free, but fluorescent-marked antibodies have been used to subsequently verify the binding on the cantilever surface. The bending and increase in mass of each cantilever has also been investigated using a light interferometer and a Doppler Vibrometer. The system has been analyzed during repeated measurements to investigate whether the CantiLab4© system is a suited platform for a pesticide assay system.