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Sample records for afm x-ray photoelectron

  1. X-ray Photoelectron Spectroscopy Database (Version 4.1)

    National Institute of Standards and Technology Data Gateway

    SRD 20 X-ray Photoelectron Spectroscopy Database (Version 4.1) (Web, free access)   The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.

  2. Recent applications of hard x-ray photoelectron spectroscopy

    DOE PAGES

    Weiland, Conan; Rumaiz, Abdul K.; Pianetta, Piero; ...

    2016-05-05

    Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in-situ or in-operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. We also present physical considerations that differentiate HAXPES from photoemission measurements utilizing soft and ultraviolet x rays.

  3. Beyond hard x-ray photoelectron spectroscopy: Simultaneous combination with x-ray diffraction

    SciTech Connect

    Rubio-Zuazo, Juan; Castro, German R.

    2013-05-15

    Hard x-ray photoelectron spectroscopy (HAXPES) is a powerful and novel emerging technique for the nondestructive determination of electronic properties and chemical composition of bulk, buried interfaces and surfaces. It benefits from the exceptionally large escape depth of high kinetic energy photoelectrons, increasing the information depth up to several tens of nanometers. Complementing HAXPES with an atomic structure sensitive technique (such as x-ray diffraction) opens a new research field with major applications for materials science. At SpLine, the Spanish CRG beamline at the European Synchrotron Radiation Facility, we have developed a novel experimental set-up that combines HAXPES and x-ray diffraction (x-ray reflectivity, surface x-ray diffraction, grazing incidence x-ray diffraction, and reciprocal space maps). Both techniques can be operated simultaneously on the same sample and using the same excitation source. The set-up includes a robust 2S + 3D diffractometer hosting a ultrahigh vacuum chamber equipped with a unique photoelectron spectrometer (few eV < electron kinetic energy < 15 keV), x-ray tube (Mg/Ti), 15 keV electron gun, and auxiliary standard surface facilities (molecular beam epitaxy evaporator, ion gun, low energy electron diffraction, sample heating/cooling system, leak valves, load-lock sample transfer, etc.). This end-station offers the unique possibility of performing simultaneous HAXPES + x-ray diffraction studies. In the present work, we describe the experimental set-up together with two experimental examples that emphasize its outstanding capabilities: (i) nondestructive characterization of the Si/Ge and HfO{sub 2}/SiO{sub 2} interfaces on Ge-based CMOS devices, and (ii) strain study on La{sub 0.7}Ca{sub 0.3}MnO{sub 3} ultrathin films grown on SrTiO{sub 3}(001) substrate.

  4. Photoelectron and X-ray Absorption Spectroscopy Of Pu

    SciTech Connect

    Tobin, J; Chung, B; Schulze, R; Farr, J; Shuh, D

    2003-11-12

    We have performed Photoelectron Spectroscopy and X-Ray Absorption Spectroscopy upon highly radioactive samples of Plutonium at the Advanced Light Source in Berkeley, CA, USA. First results from alpha and delta Plutonium are reported as well as plans for future studies of actinide studies.

  5. Hard x-ray photoelectron spectroscopy and x-ray standing waves

    NASA Astrophysics Data System (ADS)

    Lee, Tien-Lin

    2006-03-01

    Using the brilliant undulator radiation available from the third generation synchrotron sources, hard x-ray photoelectron spectroscopy (HAXPES) has become an emerging field in the recent years. With the excitation energy used in HAXPES one can benefits from the large mean free path of fast electrons (˜ 5 nm for electrons of 6 keV kinetic energy) in probing the bulk electronic properties of materials. For high-resolution studies, photon energy bandwidth narrower than 100 meV is also readily achievable in the hard x-ray range with crystal monochromators. In addition, working with hard x-ray offers the possibility for combining photoelectron spectroscopy with x-ray standing wave (XSW) method. With the high spatial resolution from XSWs, this unique combination can provide site-specific, chemical and electronic information for studying surfaces, buried interfaces, thin films and bulk crystals. In this talk, I will briefly mention some HAXPES experiments detecting electrons up to 14.5 keV [1,2]. I will then sketch the principle of combining XSWs with HAXPES and present results from some recent applications using this combination: (1) chemical state-specific surface structure determination with core-level photoemission, (2) site-specific valence x-ray photoelectron spectroscopy and (3) XSW imaging with core-level photoemission. [1] S. Thiess, C. Kunz, B.C.C. Cowie, T.-L. Lee, M. Renier, and J. Zegenhagen. Solid State Communications 132, 589 (2004) [2] C. Kunz, S. Thiess, B.C.C. Cowie, T.-L. Lee, and J. Zegenhagen, Nuclear Instruments and Methods A 547, 73 (2005).

  6. Probing deeper by hard x-ray photoelectron spectroscopy

    SciTech Connect

    Risterucci, P.; Renault, O. Martinez, E.; Delaye, V.; Detlefs, B.; Zegenhagen, J.; Gaumer, C.; Grenet, G.; Tougaard, S.

    2014-02-03

    We report an hard x-ray photoelectron spectroscopy method combining high excitation energy (15 keV) and improved modelling of the core-level energy loss features. It provides depth distribution of deeply buried layers with very high sensitivity. We show that a conventional approach relying on intensities of the core-level peaks is unreliable due to intense plasmon losses. We reliably determine the depth distribution of 1 ML La in a high-κ/metal gate stack capped with 50 nm a-Si. The method extends the sensitivity of photoelectron spectroscopy to depths beyond 50 nm.

  7. Effect of X-ray flux on polytetrafluoroethylene in X-ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.; Pepper, S. V.

    1982-01-01

    The effect of the X-ray flux in X-ray photoelectron spectroscopy (STAT) on the constitution of the polytetrafluoroethylene (PTFE) surface has been examined. The radiation dose rate for our specimen was about 10 to the 7th rad/s. The structure, magnitude and binding energy of the C(1s) and F(1s) features of the XPS spectrum and the mass spectrum of gaseous species evolved during irradiation are observed. The strong time dependence of these signals over a period of several hours indicated that the surface constitution of PTFE is greatly affected by this level of radiation dose. The results are consistent with the development of a heavily cross-linked or branched structure in the PTFE surface region and the evolution of short chain fragments into the gas phase.

  8. X-ray photoelectron spectroscopy in the hard x-ray regime

    NASA Astrophysics Data System (ADS)

    Fadley, Charles S.

    2006-03-01

    Photoelectron spectroscopy is by now a very widely used tool for the study of atoms, molecules, solids, surfaces, and nanoscale structures. Until very recently, the exciting radiation has been limited to the energy range below about 2 keV. However, within the past few years, a few experimental projects have been initiated in which photon energies in the 5-15 keV range are employed. By matching the characteristics of undulator beamlines at third-generation synchrotron radiation sources to the optical properties of the electron spectrometer, it has proven possible to overcome the reduced photoelectric cross sections at such high energies and to study both core and valence electronic levels with resolutions down to ca. 50 meV [1]. Such hard x-ray photoelectron spectroscopy (HXPS or HAXPES) has the advantage of being more bulk sensitive, with electron inelastic attenuation lengths in the 50-150 Angstrom range. In this talk, I will discuss the advantages and disadvantages of this new direction, including highlights from recent work, as well as suggested future avenues for HXPS studies. [1] Nuclear Instruments and Methods A 547, 24 (2005), special issue dedicated to hard x-ray photoelectron spectroscopy, edited by J. Zegenhagen and C. Kunz.

  9. X-ray Photoelectron Spectroscopy of Isolated Nanoparticles.

    PubMed

    Sublemontier, Olivier; Nicolas, Christophe; Aureau, Damien; Patanen, Minna; Kintz, Harold; Liu, Xiaojing; Gaveau, Marc-André; Le Garrec, Jean-Luc; Robert, Emmanuel; Barreda, Flory-Anne; Etcheberry, Arnaud; Reynaud, Cécile; Mitchell, James B; Miron, Catalin

    2014-10-02

    X-ray photoelectron spectroscopy (XPS) is a very efficient and still progressing surface analysis technique. However, when applied to nano-objects, this technique faces drawbacks due to interactions with the substrate and sample charging effects. We present a new experimental approach to XPS based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system. The structure of the Si/SiO2 interface was probed without any substrate interaction or charging effects for silicon nanocrystals previously oxidized in ambient air. Complete characterization of the surface was obtained. The Si 2p core level spectrum reveals a nonabrupt interface.

  10. Scanning electron and atomic force microscopy, and raman and x-ray photoelectron spectroscopy characterization of near-isogenic soft and hard wheat kernels and corresponding flours

    Technology Transfer Automated Retrieval System (TEKTRAN)

    Atomic force microscopy (AFM), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) are used to investigate vitreous (hard) and non-vitreous (soft) wheat kernels and their corresponding wheat flours. AFM data reveal two different microstructures. The vitreous kernel reveals a granular text...

  11. X-ray photoelectron spectra of MgH2

    NASA Astrophysics Data System (ADS)

    He, Z. X.; Pong, W.

    1990-06-01

    Measurements of X-ray photoemission from magnesium hydride MgH2 were made in an effort to further the fundamental understanding of the electronic structure of this metal hydride. The polycrystalline MgH2 was compressed onto a metal holder to provide a smooth solid surface in a dry nitrogen box and then transferred into a ESCA system without exposure to air. Measurements were made immediately after the surface was scrapped in the vacuum. The binding energies of the photoelectrons from Mg 2s and 2p states were found to be 88.9 ± 0.2eV, and 50.1 ± 0.2eV, respectively. The valence band spectrum shows an effective base width of approximately 8.8eV, which is in reasonable agreement with the recent band structure calculation for MgH2. The photoelectron spectra also display features that can be identified as volume plasmon energy loss of 14.6 ± 0.2eV. The data can be shown to be useful in calculating the average band gap energy (5.80eV) for MgH2.

  12. Corrosion and degradation studies utilizing X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Hixson, Holly Gwyndolen

    1997-08-01

    This dissertation involves studies of corrosion behavior at the surface of various metal samples, as well as the degradation of wool fibers obtained from the Star-Spangled Banner. Molybdenum metal and iron-zinc alloys were examined under corrosive conditions, and the degradation of the wool fibers was studied. The behavior of a polished molybdenum metal surface upon exposure to both aerated and deaerated water and 1.0 M NaCl solution was studied by X-ray Photoelectron Spectroscopy (XPS). Exposure to deaerated water and NaCl failed to produce oxidation of the metal surfaces, but exposing the polished metal surface to aerated water produced significant oxidation. Metal surfaces cleaned by argon-ion etching were found to be inert to oxidation by aerated water. The etching process also appears to passivate the metal surface. The behavior of molybdenum metal in 0.5 M Hsb2SOsb4 treated at various potentials has been studied using core and valence band XPS. The study indicates that Mosp{IV} and Mosp{VI} (including possibly Mosp{V} in some cases) were formed as the potential of the system was increased within the active range of molybdenum. The corrosive behavior of iron-zinc alloys that have been electroplated on plain steel in both aerated and deaerated quadruply-distilled water has been studied using XPS. Several different iron-zinc alloys were electroplated for comparative purposes: an iron-rich alloy, a zinc-rich alloy, and an alloy of similar iron and zinc composition. Treatment in aerated water produces oxidation for the iron-rich and similar composition alloys, but the oxide is reduced for the zinc-rich alloy. Degradation of the fibers in the original Star-Spangled Banner has been monitored using XPS and Scanning Electron Microscopy (SEM). Comparison of white and red wool fibers and linen fibers from the flag with new, mechanically-abraded, and chemically-treated white, red, and linen fibers, respectively, was performed in an attempt to determine the fibers' levels

  13. Evaluating Superconducting YBCO Film Properties Using X-Ray Photoelectron Spectroscopy (Postprint)

    DTIC Science & Technology

    2012-02-01

    AFRL-RZ-WP-TP-2012-0093 EVALUATING SUPERCONDUCTING YBCO FILM PROPERTIES USING X-RAY PHOTOELECTRON SPECTROSCOPY (POSTPRINT) Paul N. Barnes...2012 Conference Paper Postprint 01 January 2002 – 01 January 2004 4. TITLE AND SUBTITLE EVALUATING SUPERCONDUCTING YBCO FILM PROPERTIES USING X-RAY

  14. X-ray Photoelectron Spectroscopy (XPS), Rutherford Back Scattering (RBS) studies

    NASA Technical Reports Server (NTRS)

    Neely, W. C.; Bozak, M. J.; Williams, J. R.

    1993-01-01

    X-ray photoelectron spectroscopy (XPS), Rutherford Back Scattering (RBS) studies of each of sample received were completed. Since low angle X-ray could not be performed because of instrumentation problems, Auger spectrometry was employed instead. The results of these measurements for each of the samples is discussed in turn.

  15. Photoelectron dynamics in x-ray free-electron-laser diffractive imaging of biological samples.

    PubMed

    Hau-Riege, Stefan P

    2012-06-08

    X-ray free electron lasers hold the promise of enabling atomic-resolution diffractive imaging of single biological molecules. We develop a hybrid continuum-particle model to describe the x-ray induced damage and find that the photoelectron dynamics and electrostatic confinement strongly affect the time scale of the damage processes. These phenomena are not fully captured in hydrodynamic modeling approaches.

  16. Custom AFM for X-ray beamlines: in situ biological investigations under physiological conditions

    PubMed Central

    Gumí-Audenis, B.; Carlà, F.; Vitorino, M. V.; Panzarella, A.; Porcar, L.; Boilot, M.; Guerber, S.; Bernard, P.; Rodrigues, M. S.; Sanz, F.; Giannotti, M. I.; Costa, L.

    2015-01-01

    A fast atomic force microscope (AFM) has been developed that can be installed as a sample holder for grazing-incidence X-ray experiments at solid/gas or solid/liquid interfaces. It allows a wide range of possible investigations, including soft and biological samples under physiological conditions (hydrated specimens). The structural information obtained using the X-rays is combined with the data gathered with the AFM (morphology and mechanical properties), providing a unique characterization of the specimen and its dynamics in situ during an experiment. In this work, lipid monolayers and bilayers in air or liquid environment have been investigated by means of AFM, both with imaging and force spectroscopy, and X-ray reflectivity. In addition, this combination allows the radiation damage induced by the beam on the sample to be studied, as has been observed on DOPC and DPPC supported lipid bilayers under physiological conditions. PMID:26524300

  17. Photoelectron range limitations to the spatial resolution for x-rays in gas proportional chambers

    SciTech Connect

    Smith, G.C.; Fischer, J.; Radeka, V.

    1983-11-01

    Measurements have been made, for x-ray energies from a few keV to 18 keV, of the limiting spatial resolution caused by the finite range of the photoelectron, or electrons, created when an x-ray is absorbed in the gas of a proportional chamber. In hydrocarbon gases such as methane and ethane, where the photoelectron receives the bulk of the x-ray energy, the limiting spatial resolution is found to vary as a power law of x-ray energy. In argon and xenon, at an x-ray energy approximately twice that of the A/sub K/ edge and the Xe/sub L/ edge respectively, the measured limiting resolution is better than expected from an equivalent power law behavior.

  18. X-ray photoelectron spectroscopy peak assignment for perfluoropolyether oils

    NASA Technical Reports Server (NTRS)

    Mori, Shigeyuki; Morales, Wilfredo

    1990-01-01

    Perfluoroalkylpolyether (PFPE) oils are increasingly being used as vacuum pump oils and as lubricants for magnetic recording media and instrumentation for satellites. In this paper, the relative binding energies of three PFPE oils are determined. When sample oils are continuously irradiated during X-ray spectroscopy (XPS) measurements, the relative peak intensity of the spectra is altered significantly, indicating that gaseous products form from the oils during XPS measurements. Thus, attention should be paid to chemical changes when XPE is used to characterize fluorinated carbons such as PFPE oils.

  19. Polytetrafluoroethylene transfer film studied with X-ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.

    1980-01-01

    Polytetrafluoroethylene (PTFE) was rubbed against nickel in ultrahigh vacuum at loads up to 3.9 N and speeds up to 94 mm/sec. The transfer film formed on the nickel was analyzed using X-ray phototectron spectroscopy. The film was indistinguishable from bulk PTFE except for the possible presence of a small amount of NiF2. The transfer film was found to be about 1 molecule (0.5 nm) thick under all conditions; but at speeds above 10 mm/sec, there was evidence of bulk transfer in the form of fragments as well. The thickness measurements required a choice among conflicting published values of the inelastic mean free path for electrons in polymers. The values chosen gave internally consistent results.

  20. Magnetic x-ray linear dichroism in the photoelectron spectroscopy of ultrathin magnetic alloy films

    NASA Astrophysics Data System (ADS)

    Tobin, J. G.; Goodman, K. W.; Mankey, G. J.; Willis, R. F.; Denlinger, J. D.; Rotenberg, E.; Warwick, A.

    1996-04-01

    The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy. FeNi and CoFe epitaxial films were grown on Cu(001), in situ and using molecular beam epitaxy techniques. The magnetic x-ray linear dichroism measurements were made at the Spectromicroscopy Facility of the Third Generation Advanced Light Source. Because soft x-rays were used to generate photoemission from the 3p core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously.

  1. Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope

    NASA Astrophysics Data System (ADS)

    Hwu, Y.; Lai, B.; Mancini, D. C.; Je, J. H.; Noh, D. Y.; Bertolo, M.; Tromba, G.; Margaritondo, G.

    1999-10-01

    We show that a photoelectron spectromicroscope of the photoelectron emission microscope type can be used as an x-ray imaging detector for radiology. Using high penetration hard-x-ray photons (wavelength <0.1 nm), samples as thick as a few millimeters can be imaged with submicron resolution. The high imaging resolution enables us to substantially decrease the object-detector distance needed to observe coherent based contrast enhancement with respect to the standard film-based detection technique. Our result implies several advantages, the most important being a marked reduction of the required source emittance for contrast enhanced radiology.

  2. Hard x-ray photoelectron spectroscopy of chalcopyrite solar cell components

    NASA Astrophysics Data System (ADS)

    Gloskovskii, A.; Jenkins, C. A.; Ouardi, S.; Balke, B.; Fecher, G. H.; Dai, X.-F.; Gruhn, T.; Johnson, B.; Lauermann, I.; Caballero, R.; Kaufmann, C. A.; Felser, C.

    2012-02-01

    Hard x-ray photoelectron spectroscopy is used to examine the partial density of states of Cu(In,Ga)Se2 (CIGSe), a semiconducting component of solar cells. The investigated, thin Cu(In,Ga)Se2 films were produced by multi-stage co-evaporation. Details of the measured core level and valence band spectra are compared to the calculated density of states. The semiconducting type electronic structure of Cu(In,Ga)Se2 is clearly resolved in the hard x-ray photoelectron spectra.

  3. Total reflection X-ray photoelectron spectroscopy as a semiconductor lubricant elemental analysis method

    NASA Astrophysics Data System (ADS)

    Alshehabi, Abbas; Sasaki, Nobuharu; Kawai, Jun

    2015-12-01

    Photoelectron spectra from a typical hard disk storage media device (HDD) were measured at total reflection and non-total reflection at unburnished, acetone-cleaned, and argon-sputtered conditions. F, O, N, and C usually making the upper layer of a typical hard disk medium were detected. Enhancement of the photoelectron emission of the fluorocarbon lubricant was observed at total reflection. Pt and Co were only found by non-total X-ray photoelectron spectroscopy (XPS) because they are constituents of a deeper region than the top and interface regions. Argon-sputtered, ultrasonic acetone-cleaned, and unburnished top layers were compared at total and non-total reflection conditions. Total reflection X-ray photoelectron spectroscopy (TRXPS) is demonstrated to be a powerful tool for storage media lubrication layer chemical state analysis, reliable for industrial quality control application , and reproducible.

  4. X-ray photoelectron spectroscopy studies of the sodium chloride surface after laser exposure

    NASA Astrophysics Data System (ADS)

    Savintsev, A. P.; Gavasheli, Yu O.; Kalazhokov, Z. Kh; Kalazhokov, Kh Kh

    2016-11-01

    The surface of NaCl crystals outside and in the crater was examined using an x-ray photoelectron spectrometer. The comparative analysis of the XPS spectra showed that high- intensity laser irradiation has a significant impact on the state and composition of the surface of the ionic crystal.

  5. An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

    DTIC Science & Technology

    1987-07-15

    Deposition, volycrystalline ? Silver, 0xidianiline (ODA), Benzenetetracarboxylic anhydride (PMDA), .- imidization, polymer , in situ, X-ray Photoelectron...imidization reaction leading to polymer formation was followed in situ with X-ray Photoelectron Spectroscopy. The uncertainties inherent in a...is an important polymer for application in solid state electronic technology because of its favorable dielectric properties and high thermal

  6. Linear dimerized Se chains in cancrinite nanochannels: X-ray diffraction and photoelectron spectra

    NASA Astrophysics Data System (ADS)

    Poborchii, V. V.; Sato, M.; Shchukarev, A. V.

    1997-09-01

    Cancrinite crystals containing adsorbed selenium in 1-dimensional nanochannels (Can-Se) have been examined by X-ray diffraction, X-ray photoelectron spectroscopy and polarized infrared spectroscopy. It is found that adsorbed selenium forms Se 22- anions substituting OH - groups inside channels. Se 22- dimers are located in the center of the cancrinite channel and oriented along the channel. They interact with Na + cations located in the channels and with each other giving rise to a linear chain incommensurate to the cancrinite matrix. The arrangement of the dimers in the chain has been found to be dependent on the temperature.

  7. X-ray photoelectron spectroscopy and atomic force microscopy characterization of the effects of etching Zn xCd 1- xTe surfaces

    NASA Astrophysics Data System (ADS)

    George, M. A.; Azoulay, M.; Jayatirtha, H. N.; Burger, A.; Collins, W. E.; Silberman, E.

    1993-10-01

    X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) was used for the first time to characterize the chemical composition of modified surfaces of Zn xCd 1- xTe single crystals. These surface treatments were selected for their relevance to device preparation procedures. The XPS peaks indicated an increase of the tellurium and a depletion of the cadmium concentrations upon etching in bromine methanol solution. AFM revealed the formation of pronounced Te inclusions. Higher x values correlated with a decrease in residual bromine left on the surface, while cut and polished samples had higher oxide concentrations and increased bromination of the surface than cleaved samples.

  8. A lab-based ambient pressure x-ray photoelectron spectrometer with exchangeable analysis chambers

    SciTech Connect

    Newberg, John T. Arble, Chris; Goodwin, Chris; Khalifa, Yehia; Broderick, Alicia; Åhlund, John

    2015-08-15

    Ambient pressure X-ray photoelectron spectroscopy (APXPS) is a powerful spectroscopy tool that is inherently surface sensitive, elemental, and chemical specific, with the ability to probe sample surfaces under Torr level pressures. Herein, we describe the design of a new lab-based APXPS system with the ability to swap small volume analysis chambers. Ag 3d(5/2) analyses of a silver foil were carried out at room temperature to determine the optimal sample-to-aperture distance, x-ray photoelectron spectroscopy analysis spot size, relative peak intensities, and peak full width at half maximum of three different electrostatic lens modes: acceleration, transmission, and angular. Ag 3d(5/2) peak areas, differential pumping pressures, and pump performance were assessed under varying N{sub 2}(g) analysis chamber pressures up to 20 Torr. The commissioning of this instrument allows for the investigation of molecular level interfacial processes under ambient vapor conditions in energy and environmental research.

  9. A lab-based ambient pressure x-ray photoelectron spectrometer with exchangeable analysis chambers

    NASA Astrophysics Data System (ADS)

    Newberg, John T.; Åhlund, John; Arble, Chris; Goodwin, Chris; Khalifa, Yehia; Broderick, Alicia

    2015-08-01

    Ambient pressure X-ray photoelectron spectroscopy (APXPS) is a powerful spectroscopy tool that is inherently surface sensitive, elemental, and chemical specific, with the ability to probe sample surfaces under Torr level pressures. Herein, we describe the design of a new lab-based APXPS system with the ability to swap small volume analysis chambers. Ag 3d(5/2) analyses of a silver foil were carried out at room temperature to determine the optimal sample-to-aperture distance, x-ray photoelectron spectroscopy analysis spot size, relative peak intensities, and peak full width at half maximum of three different electrostatic lens modes: acceleration, transmission, and angular. Ag 3d(5/2) peak areas, differential pumping pressures, and pump performance were assessed under varying N2(g) analysis chamber pressures up to 20 Torr. The commissioning of this instrument allows for the investigation of molecular level interfacial processes under ambient vapor conditions in energy and environmental research.

  10. A lab-based ambient pressure x-ray photoelectron spectrometer with exchangeable analysis chambers.

    PubMed

    Newberg, John T; Åhlund, John; Arble, Chris; Goodwin, Chris; Khalifa, Yehia; Broderick, Alicia

    2015-08-01

    Ambient pressure X-ray photoelectron spectroscopy (APXPS) is a powerful spectroscopy tool that is inherently surface sensitive, elemental, and chemical specific, with the ability to probe sample surfaces under Torr level pressures. Herein, we describe the design of a new lab-based APXPS system with the ability to swap small volume analysis chambers. Ag 3d(5/2) analyses of a silver foil were carried out at room temperature to determine the optimal sample-to-aperture distance, x-ray photoelectron spectroscopy analysis spot size, relative peak intensities, and peak full width at half maximum of three different electrostatic lens modes: acceleration, transmission, and angular. Ag 3d(5/2) peak areas, differential pumping pressures, and pump performance were assessed under varying N2(g) analysis chamber pressures up to 20 Torr. The commissioning of this instrument allows for the investigation of molecular level interfacial processes under ambient vapor conditions in energy and environmental research.

  11. Theoretical Model For Photoelectron Transport In X-Ray Lithography Systems

    NASA Astrophysics Data System (ADS)

    Garth, J. C.

    1983-11-01

    We have developed a theoretical model for calculating the dose received by a resist behind an x-ray absorbing mask in an x-ray lithography system. The model enables the dose-depth profile due to photoelectrons entering the resist from the mask to be predicted as a function of x-ray target material, excitation voltage, mask material and thickness, and chemical composition of the resist. As an application, we have calculated the dose profile in the resist PBS next to a Au mask irradiated by x-rays from Ag and Al targets operated at 10 kilovolt beam voltage. The characteristic line and continuum spectrum from the targets are computed, the absorption by the Au mask obtained, and an approximate photoelectron and Auger electron spectrum in the gold and PBS is evaluated. The dose-depth curve next to the gold-resist interface is found using the analytic electron transport model developed by Burke and Garth (1979). The calculations show that the dose profiles obtained using bremsstrahlung-produced electrons extend deeper than profiles than are computed from characteristic photon radiation alone. At 10 kV, this effect is found to be much greater for Ag than for Al.

  12. X-ray photoelectron spectroscopy of γ-ray-irradiated single-stranded DNA

    NASA Astrophysics Data System (ADS)

    Lee, Eunmo; Hong, W.; Han, J. H.; Choi, D. M.; Lee, Cheol Eui; Kim, H. D.; Kim, J.

    2015-07-01

    The effects of γ-ray irradiation on herring sperm single-stranded DNA have been studied by using X-ray photoelectron spectroscopy (XPS) in the view of the bonding configurations and the structural modifications. The significant changes in the hydrogen, carbon, nitrogen, and phosphorous bonding energies, as revealed by the XPS analysis, indicate that electron transfers result in the creation of radicals and in DNA strand breaks.

  13. An X-Ray Photoelectron Spectroscopy (XPS) Study of Activated Carbons Impregnated with some Organocopper Complexes,

    DTIC Science & Technology

    1993-10-01

    AD-A282 721 l lllllll a Dfene Defence nationals AN X.RAY PHOTOELECTRON SPECTROSCOPY (XPS) STUDY OF ACTIVATED CARBONS IMPREGNATED WITH SOME... ammoniacal solution as a carrier into which all impregnants (except TEDA) were dissolved. Without a suitable carrier, and with the inherent low vapor...and will not be repeated here. All five complexes were synthesized at DREO using known methods. 2 2.2 IMPREGNATING PROCEDURES Two impregnating

  14. Presence of monovalent oxygen anions in oxides demonstrated using X-ray photoelectron spectra

    SciTech Connect

    Wu, L. Q.; Li, Z. Z.; Tang, G. D. Qi, W. H.; Xue, L. C.; Ding, L. L.; Ge, X. S.; Li, S. Q.; Li, Y. C.

    2016-01-11

    The oxygen vacancy model has been used to explain the magnetic and electrical transport properties of dilute magnetic semiconductors and resistive switching. In particular, some authors have claimed that they found a symmetric peak corresponding to the oxygen vacancies in O1s photoelectron spectra. In this paper, using X-ray photoelectron spectra with argon ion etching, it is shown that this symmetric peak may also be interpreted as being related to O{sup 1−} anions, rather than to oxygen vacancies.

  15. Hard X-ray photoelectron and X-ray absorption spectroscopy characterization of oxidized surfaces of iron sulfides

    NASA Astrophysics Data System (ADS)

    Mikhlin, Yuri; Tomashevich, Yevgeny; Vorobyev, Sergey; Saikova, Svetlana; Romanchenko, Alexander; Félix, Roberto

    2016-11-01

    Hard X-ray photoelectron spectroscopy (HAXPES) using an excitation energy range of 2 keV to 6 keV in combination with Fe K- and S K-edge XANES, measured simultaneously in total electron (TEY) and partial fluorescence yield (PFY) modes, have been applied to study near-surface regions of natural polycrystalline pyrite FeS2 and pyrrhotite Fe1-xS before and after etching treatments in an acidic ferric chloride solution. It was found that the following near-surface regions are formed owing to the preferential release of iron from oxidized metal sulfide lattices: (i) a thin, no more than 1-4 nm in depth, outer layer containing polysulfide species, (ii) a layer exhibiting less pronounced stoichiometry deviations and low, if any, concentrations of polysulfide, the composition and dimensions of which vary for pyrite and pyrrhotite and depend on the chemical treatment, and (iii) an extended almost stoichiometric underlayer yielding modified TEY XANES spectra, probably, due to a higher content of defects. We suggest that the extended layered structure should heavily affect the near-surface electronic properties, and processes involving the surface and interfacial charge transfer.

  16. X-ray and photoelectron spectroscopy of the structure, reactivity, and electronic structure of semiconductor nanocrystals

    SciTech Connect

    Hamad, Kimberly Sue

    2000-01-01

    Semiconductor nanocrystals are a system which has been the focus of interest due to their size dependent properties and their possible use in technological applications. Many chemical and physical properties vary systematically with the size of the nanocrystal and thus their study enables the investigation of scaling laws. Due to the increasing surface to volume ratio as size is decreased, the surfaces of nanocrystals are expected to have a large influence on their electronic, thermodynamic, and chemical behavior. In spite of their importance, nanocrystal surfaces are still relatively uncharacterized in terms of their structure, electronic properties, bonding, and reactivity. Investigation of nanocrystal surfaces is currently limited by what techniques to use, and which methods are suitable for nanocrystals is still being determined. This work presents experiments using x-ray and electronic spectroscopies to explore the structure, reactivity, and electronic properties of semiconductor (CdSe, InAs) nanocrystals and how they vary with size. Specifically, x-ray absorption near edge spectroscopy (XANES) in conjunction with multiple scattering simulations affords information about the structural disorder present at the surface of the nanocrystal. X-ray photoelectron spectroscopy (XPS) and ultra-violet photoelectron spectroscopy (UPS) probe the electronic structure in terms of hole screening, and also give information about band lineups when the nanocrystal is placed in electric contact with a substrate. XPS of the core levels of the nanocrystal as a function of photo-oxidation time yields kinetic data on the oxidation reaction occurring at the surface of the nanocrystal.

  17. Correlation of magnetic dichroism in x-ray absorption and photoelectron emission using ultrathin magnetic alloy films

    SciTech Connect

    Tobin, J.G.; Goodman, K.W.; Mankey, G.J.; Willis, R.F.; Denlinger, J.D.; Rotenberg, E.; Warwick, A.

    1996-04-01

    We have begun a program to characterize magnetic alloy overlays using both magnetic x-ray circular dichroism (MXCD) and magnetic x-ray linear dichroism (MXLD). This will allow a direct comparison of MXCD-absorption and MXLD-photoelectron emission. First results from the Advanced Light Source will be presented.

  18. X-ray laser-induced photoelectron spectroscopy for single-state measurements

    NASA Astrophysics Data System (ADS)

    Nelson, A. J.; Dunn, J.; van Buuren, T.; Hunter, J.

    2004-12-01

    We demonstrate single-shot x-ray laser-induced time-of-flight photoelectron spectroscopy on metal and semiconductor surfaces with picosecond time resolution. Our compact multipulse terawatt tabletop x-ray laser source provides the necessary high photon flux (>1012/pulse), monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Static valence band and shallow core-level photoemission spectra are presented for ambient temperature polycrystalline Cu foils and Ge(100). Surface contamination was removed by UV ozone cleaning prior to analysis. The ultrafast nature of this technique lends itself to true single-state measurements of shocked and heated materials.

  19. X-Ray Laser Induced Photoelectron Spectroscopy for Single-State Measurements

    SciTech Connect

    Nelson, A J; Dunn, J; van Buuren, T; Hunter, J

    2004-07-14

    We demonstrate single-shot x-ray laser induced time-of-flight photoelectron spectroscopy on metal and semiconductor surfaces with picosecond time resolution. The LLNL COMET compact tabletop x-ray laser source provides the necessary high photon flux (>10{sup 12}/pulse), monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Static valence band and shallow core-level photoemission spectra are presented for ambient temperature polycrystalline Cu foils and Ge(100). Surface contamination was removed by UV ozone cleaning prior to analysis. The ultrafast nature of this technique lends itself to true single-state measurements of shocked and heated materials.

  20. Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

    SciTech Connect

    Tsunemi, Eika; Watanabe, Yoshio; Oji, Hiroshi; Cui, Yi-Tao; Son, Jin-Young

    2015-06-21

    We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiN{sub x} membrane window. As a model chemical substance, europium (II) iodide (EuI{sub 2}) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiN{sub x} window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.

  1. Comparison of hard and soft x-ray photoelectron spectra of silicon

    NASA Astrophysics Data System (ADS)

    Offi, F.; Werner, W. S. M.; Sacchi, M.; Torelli, P.; Cautero, M.; Cautero, G.; Fondacaro, A.; Huotari, S.; Monaco, G.; Paolicelli, G.; Smekal, W.; Stefani, G.; Panaccione, G.

    2007-08-01

    A detailed comparison of the surface sensitivity of x-ray photoemission spectroscopy for hard and soft x rays is presented and discussed. Electron scattering parameters and their energy dependence are given for Si and two Si spectra are analyzed: a MgKα (hν=1253.6eV) excited spectrum of the Si2p and 2s lines and a hard x-ray excited spectrum (hν=5925eV) of the Si1s line. The differential inelastic scattering characteristics for Si are extracted from reflection electron energy loss spectra taken at energies of 1500 and 4000eV . Using these scattering characteristics and electron mean free paths from the literature, simulated spectra are compared with experiment. The experimental spectra are deconvoluted to give the true intrinsic line shape corresponding to the theoretical collision statistics when interference effects between intrinsic and extrinsic scattering are neglected. The magnitude of interference effects cannot be assessed by our analysis. Within the (unknown) uncertainty introduced by neglecting interference effects, it is possible to determine the relative intensity of intrinsic and extrinsic excitations. In this way, it is found that in the case of the soft x-ray excited photoelectron spectrum of the shallower electronic shells ( 2p and 2s ), intrinsic plasmon creation is rather weak, and the apparent asymmetric line shape of the spectrum might be interpreted as the fact that electron-hole pair creation dominates the intrinsic loss spectrum, while an alternative explanation in terms of surface core level shifted components is also proposed. For the deeper core electronic shell, probed with hard x rays, the opposite situation is observed: while intrinsic electron-hole pair creation was not observed, a strong contribution of intrinsic plasmon losses of about 30% was seen.

  2. Short-range order in amorphous SiO{sub x} by x ray photoelectron spectroscopy

    SciTech Connect

    Novikov, Yu. N.; Gritsenko, V. A.

    2011-07-01

    The Si 2p x ray photoelectron spectra of SiO{sub x} with a different composition of 0 {<=} x {<=} 2 have been studied experimentally and theoretically. The SiO{sub x} films were prepared by low-pressure chemical vapor deposition from SiH{sub 4} and N{sub 2}O source at 750 deg. C. Neither random bonding nor random mixture models can adequately describe the structure of these compounds. The interpretation of the experimental results is discussed according to a large scale potential fluctuation due to the spatial variation of chemical composition in SiO{sub x}.

  3. Composition of RF-sputtered refractory compounds determined by X-ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.; Brainard, W. A.

    1978-01-01

    RF-sputtered coatings of CrB2, MoSi2, Mo2C, TiC, and MoS2 were examined by X-ray photoelectron spectroscopy (XPS). Data on stoichiometry, impurity content, and chemical bonding were obtained. The influences of sputtering target history, deposition time, RF power level, and substrate bias were studied. Significant deviations from stoichiometry and high oxide levels were related to target outgassing. The effect of substrate bias depended on the particular coating material studied.

  4. X-ray photoelectron spectroscopy investigation on electrochemical degradation of proton exchange membrane fuel cell electrodes

    NASA Astrophysics Data System (ADS)

    Andersen, Shuang Ma; Dhiman, Rajnish; Skou, Eivind

    2015-05-01

    X-ray photoelectron spectroscopy studies were systematically carried out on the electrodes before and after the electrochemical stress tests in an aqueous electrolyte at 20 °C and 70 °C. The electrodes have different ionomer structures (no ionomer, only ionomer, physically mixed ionomer and hot pressed ionomer) but have identical, commercial catalyst and catalyst loading. A significant degree of carbon corrosion, platinum migration and ionomer degradation were observed in the electrodes after the treatment. The degradation of the ionomer in the electrode is more severe than that of membrane. The electrode structure and the corresponding interface are crucial for the catalyst performance and durability.

  5. X-ray photoelectron spectroscopy study of the effects of ultrapure water on GaAs

    NASA Astrophysics Data System (ADS)

    Massies, J.; Contour, J. P.

    1985-06-01

    X-ray photoelectron spectroscopy has been used to investigate the effects of de-ionized water on chemical etched GaAs surfaces. When the treatment with water is performed in static conditions (stagnant water) a Ga-rich oxide layer is formed on GaAs at the rate of 10-20 Å h-1. In contrast, when the GaAs surface is treated in dynamic conditions (running water), no oxide buildup is observed. Moreover, running water can remove the oxide film formed in static conditions, as well as oxidized layers due to air exposure. These results are discussed in the framework of cleaning prior to molecular beam epitaxy.

  6. Making use of x-ray optical effects in photoelectron-, Auger electron-, and x-ray emission spectroscopies: Total reflection, standing-wave excitation, and resonant effects

    SciTech Connect

    Yang, S.-H.; Gray, A. X.; Kaiser, A. M.; Mun, B. S.; Sell, B. C.; Kortright, J. B.; Fadley, C. S.

    2013-02-21

    We present a general theoretical methodology and related open-access computer program for carrying out the calculation of photoelectron, Auger electron, and x-ray emission intensities in the presence of several x-ray optical effects, including total reflection at grazing incidence, excitation with standing-waves produced by reflection from synthetic multilayers and at core-level resonance conditions, and the use of variable polarization to produce magnetic circular dichroism. Calculations illustrating all of these effects are presented, including in some cases comparisons to experimental results. Sample types include both semi-infinite flat surfaces and arbitrary multilayer configurations, with interdiffusion/roughness at their interfaces. These x-ray optical effects can significantly alter observed photoelectron, Auger, and x-ray intensities, and in fact lead to several generally useful techniques for enhancing surface and buried-layer sensitivity, including layer-resolved densities of states and depth profiles of element-specific magnetization. The computer program used in this study should thus be useful for a broad range of studies in which x-ray optical effects are involved or are to be exploited in next-generation surface and interface studies of nanoscale systems.

  7. The GALAXIES beamline at the SOLEIL synchrotron: inelastic X-ray scattering and photoelectron spectroscopy in the hard X-ray range.

    PubMed

    Rueff, J P; Ablett, J M; Céolin, D; Prieur, D; Moreno, Th; Balédent, V; Lassalle-Kaiser, B; Rault, J E; Simon, M; Shukla, A

    2015-01-01

    The GALAXIES beamline at the SOLEIL synchrotron is dedicated to inelastic X-ray scattering (IXS) and photoelectron spectroscopy (HAXPES) in the 2.3-12 keV hard X-ray range. These two techniques offer powerful complementary methods of characterization of materials with bulk sensitivity, chemical and orbital selectivity, resonant enhancement and high resolving power. After a description of the beamline components and endstations, the beamline capabilities are demonstrated through a selection of recent works both in the solid and gas phases and using either IXS or HAXPES approaches. Prospects for studies on liquids are discussed.

  8. Quantitative x-ray photoelectron spectroscopy: Quadrupole effects, shake-up, Shirley background, and relative sensitivity factors from a database of true x-ray photoelectron spectra

    SciTech Connect

    Seah, M. P.; Gilmore, I. S.

    2006-05-01

    An analysis is provided of the x-ray photoelectron spectroscopy (XPS) intensities measured in the National Physical Laboratory (NPL) XPS database for 46 solid elements. This present analysis does not change our previous conclusions concerning the excellent correlation between experimental intensities, following deconvolving the spectra with angle-averaged reflection electron energy loss data, and the theoretical intensities involving the dipole approximation using Scofield's cross sections. Here, more recent calculations for cross sections by Trzhaskovskaya et al. involving quadrupole terms are evaluated and it is shown that their cross sections diverge from the experimental database results by up to a factor of 5. The quadrupole angular terms lead to small corrections that are close to our measurement limit but do appear to be supported in the present analysis. Measurements of the extent of shake-up for the 46 elements broadly agree with the calculations of Yarzhemsky et al. but not in detail. The predicted constancy in the shake-up contribution by Yarzhemsky et al. implies that the use of the Shirley background will lead to a peak area that is a constant fraction of the true peak area including the shake-up intensities. However, the measured variability of the shake-up contribution makes the Shirley background invalid for quantification except for situations where the sensitivity factors are from reference samples similar to those being analyzed.

  9. X-Ray Photoelectron Diffraction Studies of Structural and Magnetic Disordering Transitions Near Surfaces

    NASA Astrophysics Data System (ADS)

    Tran, Thuy Thu

    This thesis deals with order/disorder transitions near solid surfaces as studied by x-ray photoelectron diffraction and photoelectron holography. Transitions involving both atomic positional order and magnetic order have been studied. Further evidence for a reversible high-temperature surface-disordering phase transition on Ge(111) has been found using Ge 3p x-ray photoelectron diffraction (a short -range-order probe of surface structure) and photoelectron holography. Azimuthal diffraction data at takeoff angles with respect to the surface of theta = 19^circ and theta = 55^circ show abrupt drops in intensity of ~30%-40% over the temperature interval of 900-1200 K. Photoelectron holographic near-neighbor images at temperatures below and above the transition region furthermore indicate an identical near-neighbor structure for all atoms present in ordered sites. These combined diffraction and holography data show that by 1200 K, the Ge(111) surface is covered by a completely disordered overlayer of about 2 Ge monolayers in thickness. The rate of growth of this overlayer with increasing temperature is in excellent agreement with recent medium-energy ion scattering results, although the thickness we find for the overlayer is 1.5-2.0x larger than that derived from ion scattering. Based on these data, a disordering model for the Ge(111) surface phase transition occurring at 1050 K is discussed. Spin-polarized photoelectron diffraction is a recently developed and promising application of photoelectron diffraction to the study of the magnetic structure near surfaces. This technique is based on an internal source of spin-polarized electrons as produced in core-level multiplet splittings and it is thus sensitive to the short-range magnetic order around a given type of emitter in the crystal. In prior studies, it has been applied to two antiferromagnets, KMnF_3 and MnO, and the effects seen at temperatures well above the Neel (or long-range -order) temperature have been

  10. Macroscopic and X-ray photoelectron spectroscopic investigation of interactions of arsenic with synthesized pyrite.

    PubMed

    Kim, Eun Jung; Batchelor, Bill

    2009-04-15

    Interactions of arsenic with synthesized pyrite were investigated using macroscopic (solution phase experiments) and microscopic (X-ray photoelectron spectroscopic investigation) approaches. Arsenic removal by pyrite was strongly dependent on pH and arsenic species. Both arsenite (As(III)) and arsenate (As(V)) had a strong affinity for the pyrite surface under acidic conditions, but As(III) was more effectively removed than As(V). A BET isotherm equation provided the best fit to arsenic removal data, suggesting that surface precipitation occurred at a high arsenic/pyrite ratio. The addition of competing ions did not substantially affect the ultimate distribution of arsenic between the pyrite surface and the solution, but changing the pH affected arsenic stability on pyrite. X-ray photoelectron spectroscopy (XPS) revealed that under acidic conditions, arsenic was removed by reaction with pyrite to form solid phases similar to As2S3 and As4S4. However, under neutral to alkaline conditions, arsenic was removed by sorption and precipitation to form solid phases that are similar to FeAsS and As2S3/As4S4.

  11. X-ray photoelectron spectroscopy of graphitic carbon nanomaterials doped with heteroatoms.

    PubMed

    Susi, Toma; Pichler, Thomas; Ayala, Paola

    2015-01-01

    X-ray photoelectron spectroscopy (XPS) is one of the best tools for studying the chemical modification of surfaces, and in particular the distribution and bonding of heteroatom dopants in carbon nanomaterials such as graphene and carbon nanotubes. Although these materials have superb intrinsic properties, these often need to be modified in a controlled way for specific applications. Towards this aim, the most studied dopants are neighbors to carbon in the periodic table, nitrogen and boron, with phosphorus starting to emerge as an interesting new alternative. Hundreds of studies have used XPS for analyzing the concentration and bonding of dopants in various materials. Although the majority of works has concentrated on nitrogen, important work is still ongoing to identify its precise atomic bonding configurations. In general, care should be taken in the preparation of a suitable sample, consideration of the intrinsic photoemission response of the material in question, and the appropriate spectral analysis. If this is not the case, incorrect conclusions can easily be drawn, especially in the assignment of measured binding energies into specific atomic configurations. Starting from the characteristics of pristine materials, this review provides a practical guide for interpreting X-ray photoelectron spectra of doped graphitic carbon nanomaterials, and a reference for their binding energies that are vital for compositional analysis via XPS.

  12. X-ray photoelectron spectroscopy characterization of the {omega} phase in water quenched Ti-5553 alloy

    SciTech Connect

    Qin, Dongyang; Lu, Yafeng; Zhang, Kong; Liu, Qian; Zhou, Lian

    2012-11-15

    X-ray photoelectron spectroscopy was used to investigate the {omega} phase in water quenched Ti-5553 alloy with a nominal composition of Ti-5Al-5V-5Mo-3Cr (wt.%), and the {omega} and the {beta} phase were distinguished by deconvoluting the XPS spectra of Al2p, V2p and Cr2p core level regions. In addition, it is found that the binding energy of core level electron of alloying elements shifts comparing with that of pure metals, and the fact was interpreted by charge redistribution model. X-ray photoelectron spectroscopy technique could be used to characterize the nano-scale {omega} phase in {beta} alloys. - Highlights: Black-Right-Pointing-Pointer We characterize the {omega} phase in Ti-5553 alloy by XPS. Black-Right-Pointing-Pointer Binding energy of Al2p, V2p and Cr2p electron are different in the {omega} and {beta} phase. Black-Right-Pointing-Pointer Structural difference leads to the binding energy gap.

  13. Quantitative interpretation of molecular dynamics simulations for X-ray photoelectron spectroscopy of aqueous solutions

    NASA Astrophysics Data System (ADS)

    Olivieri, Giorgia; Parry, Krista M.; Powell, Cedric J.; Tobias, Douglas J.; Brown, Matthew A.

    2016-04-01

    Over the past decade, energy-dependent ambient pressure X-ray photoelectron spectroscopy (XPS) has emerged as a powerful analytical probe of the ion spatial distributions at the vapor (vacuum)-aqueous electrolyte interface. These experiments are often paired with complementary molecular dynamics (MD) simulations in an attempt to provide a complete description of the liquid interface. There is, however, no systematic protocol that permits a straightforward comparison of the two sets of results. XPS is an integrated technique that averages signals from multiple layers in a solution even at the lowest photoelectron kinetic energies routinely employed, whereas MD simulations provide a microscopic layer-by-layer description of the solution composition near the interface. Here, we use the National Institute of Standards and Technology database for the Simulation of Electron Spectra for Surface Analysis (SESSA) to quantitatively interpret atom-density profiles from MD simulations for XPS signal intensities using sodium and potassium iodide solutions as examples. We show that electron inelastic mean free paths calculated from a semi-empirical formula depend strongly on solution composition, varying by up to 30% between pure water and concentrated NaI. The XPS signal thus arises from different information depths in different solutions for a fixed photoelectron kinetic energy. XPS signal intensities are calculated using SESSA as a function of photoelectron kinetic energy (probe depth) and compared with a widely employed ad hoc method. SESSA simulations illustrate the importance of accounting for elastic-scattering events at low photoelectron kinetic energies (<300 eV) where the ad hoc method systematically underestimates the preferential enhancement of anions over cations. Finally, some technical aspects of applying SESSA to liquid interfaces are discussed.

  14. Electronic Structures of Uranium Compounds Studied by Soft X-ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Fujimori, Shin-ichi; Takeda, Yukiharu; Okane, Tetsuo; Saitoh, Yuji; Fujimori, Atsushi; Yamagami, Hiroshi; Haga, Yoshinori; Yamamoto, Etsuji; Ōnuki, Yoshichika

    2016-06-01

    The electronic structures of uranium-based compounds have been studied by photoelectron spectroscopy with soft X-ray synchrotron radiation. Angle-resolved photoelectron spectroscopy with soft X-rays has made it possible to directly observe their bulk band structures and Fermi surfaces. It has been shown that the band structures and Fermi surfaces of itinerant compounds such as UB2, UN, and UFeGa5 are quantitatively described by a band-structure calculation treating all U 5f electrons as itinerant. Furthermore, the overall electronic structures of heavy-fermion compounds such as UPd2Al3, UNi2Al3, and URu2Si2 are also explained by a band-structure calculation, although some disagreements exist, which might originate from the electron correlation effect. This suggests that the itinerant description of U 5f states is an appropriate starting point for the description of their electronic structures. The situation is similar for ferromagnetic superconductors such as UGe2, URhGe, UCoGe, and UIr, although the complications from their low-symmetry crystal structures make it more difficult to describe their detailed electronic structures. The local electronic structures of the uranium site have been probed by core-level photoelectron spectroscopy with soft X-rays. The comparisons of core-level spectra of heavy-fermion compounds with typical itinerant and localized compounds suggest that the local electronic structures of most itinerant and heavy-fermion compounds are close to the U 5f3 configuration except for UPd2Al3 and UPt3. The core-level spectrum of UPd2Al3 has similarities to those of both itinerant and localized compounds, suggesting that it is located at the boundary between the itinerant and localized states. Moreover, the spectrum of UPt3 is very close to that of the localized compound UPd3, suggesting that it is nearly localized, although there are narrow quasi-particle bands in the vicinity of EF.

  15. An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

    DTIC Science & Technology

    1987-07-15

    1985) 2857. 13. B. D. Silverman, J. W. Bartha, J. G. Clabes, P. S Ho and A. R. Rossi, J. Polym . Sci. Part A 24 (1986) 3325. 14. E. Cartier , P. Pfluger...Benzenetetracarboxylic anhydride (PMDA), imidization, polymer , in situ, X-ray Photoelectron Spectroscopy (XPS),Cu(111) 20. ABSTRACT (Continue an...ODA) and 1,2,4,5 Benzenetetracarboxylic anhydride (PMDA). The imidization reaction leading to polymer formation was followed in situ with X-ray

  16. Uses of Auger and x ray photoelectron spectroscopy in the study of adhesion and friction

    NASA Technical Reports Server (NTRS)

    Miyoshi, Kazuhisa

    1990-01-01

    Three studies are described characterizing the possible contributions of surface science to tribology. These include surface contamination formed by the interaction of a surface with the environment, contaminants obtained with diffusion of compounds, and surface chemical changes resulting from selective thermal evaporation. Surface analytical tools such as Auger electron spectroscopy (AES) and x ray photoelectron spectroscopy (XPS) incorporated directly into adhesion and friction systems are primarily used to define the nature of tribological surfaces before and after tribological experimentation and to characterize the mechanism of solid-to-solid interaction. Emphasis is on fundamental studies involving the role of surfaces in controlling the adhesion and friction properties of materials emerging as a result of the surface analyses. The materials which were studied include metals and ceramics such as elemental metals, amorphous alloys (metallic glasses), and silicon-based ceramics.

  17. X-ray photoelectron and mass spectroscopic study of electron irradiation and thermal stability of polytetrafluoroethylene

    NASA Technical Reports Server (NTRS)

    Wheeler, Donald R.; Pepper, Stephen V.

    1990-01-01

    Polytetrafluoroethylene (PTFE) was subjected to 3 keV electron bombardment and then heated in vacuum to 300 C. The behavior of the material as a function of radiation dose and temperature was studied by X-ray photoelectron spectroscopy (XPS) of the surface and mass spectroscopy of the species evolved. A quantitative comparison of the radiation dose rate with that in other reported studies showed that, for a given total dose, the damage observed by XPS is greater for higher dose rates. Lightly damaged material heated to 300 C evolved saturated fluorocarbon species, whereas unsaturated fluorocarbon species evolved from heavily damaged material. After heating the heavily damaged material, those features in the XPS that were associated with damage diminished, giving the appearance that the radiation damage annealed. The apparent annealing of the radiation damage was found to be due to the covering of the network by saturated fragments that easily diffused through the decomposed material to the surface region upon heating.

  18. The Rh oxide ultrathin film on Rh(100): an x-ray photoelectron diffraction study.

    PubMed

    Zhan, Rong Rong; Vesselli, Erik; Baraldi, Alessandro; Lizzit, Silvano; Comelli, Giovanni

    2010-12-07

    The surface and interface structure of the RhO(2) ultrathin film grown on Rh(100) is investigated by means of x-ray photoelectron diffraction. Experimental and simulated one- and two-dimensional angular distribution intensities of the O1s and Rh3d(5/2) chemically shifted core levels are quantitatively analyzed. The previously proposed O-Rh-O trilayer model is independently confirmed. A rippled buckling of the metal surface is observed at the oxide-metal interface, with a mean interfacial Rh-O distance which is 0.2 Å larger with respect to previous findings. The link between the local atomic rearrangement and the overall geometric and electronic properties of the oxide is discussed on the basis of a thorough comparison with the corresponding RhO(2) rutile structure.

  19. X-ray photoelectron and Raman spectroscopic studies of MeV proton irradiated graphite

    NASA Astrophysics Data System (ADS)

    Mathew, S.; Joseph, B.; Sekhar, B. R.; Dev, B. N.

    2008-07-01

    Poly-crystalline graphite samples were irradiated using 2.25 MeV H + ions with a fluence of 2 × 10 17 ions/cm 2. Magnetic ordering in highly oriented pyrolytic graphite samples have been reported earlier under the similar irradiation conditions [Esquinazi et al., Phys. Rev. Lett. 91 (2003) 227201]. In that study, the authors attribute the observed irradiation induced magnetic ordering to the formation of a mixed sp 2-sp 3 hybridized carbon atoms. In the present study, we report the X-ray photoelectron and Raman spectroscopic studies on pristine and irradiated samples. Irradiated samples are found to show an increased number of sp 3 hybridized carbon atoms. However, the Raman spectrum, specially the second order data, do indicate that the nature of the graphene lattice structure has been preserved in the irradiated samples. The mechanisms for the irradiation induced enhancement in sp 3 hybridization are discussed.

  20. Assessment of the weathering of protective coatings using x-ray photoelectron spectroscopy

    SciTech Connect

    Wilson, G.R.; Skerry, B.S.

    1993-12-31

    Three fully formulated coatings systems: polyurethane, alkyd and latex, were exposed either outdoors to a natural industrial atmospheric environment or to an accelerated corrosion/weathering test incorporating UV-condensation exposures and wet/dry corrosion cycling or to an RF generated {open_quotes}in-glow{close_quotes} oxygen plasma. Changes in coating surface chemistry as a function of time in each environment were followed using X-ray photoelectron spectroscopy (XPS). XPS detected changes in the surface composition of all three systems for all three environmentS. Some of the trends in degradation detected on the exterior exposed samples were reproduced by both accelerated tests. The data obtained from this study also suggested that the corrosion/weathering test would benefit from an increase in the amount of UV exposure over that which is currently used. Oxygen plasma etching also appears to have some potential as a tool for accelerated weathering of paint systems.

  1. X-ray photoelectron spectroscopy study of chemically-etched Nd-Ce-Cu-O surfaces

    NASA Technical Reports Server (NTRS)

    Vasquez, R. P.; Gupta, A.; Kussmaul, A.

    1991-01-01

    Acetic acid, Br2, and HCl solutions are investigated for removing insulating species from Nd(1.85)Ce(0.15)CuO(4-delta) (NCCO) thin film surfaces. X-ray photoelectron spectroscopy (XPS) shows that the HCl etch is most effective, yielding O 1s spectra comparable to those obtained from samples cleaned in vacuum and a clear Fermi edge in the valence band region. Reduction and oxidation reversibly induces and eliminates, respectively, Fermi level states for undoped samples, but has no clearly observable effect on the XPS spectra for doped samples. Reactivity to air is much less for NCCO compared to hole superconductors, which is attributed to the lack of reactive alkaline earth elements in NCCO.

  2. X-ray photoelectron spectroscopy study of excimer laser treated alumina films

    NASA Astrophysics Data System (ADS)

    Georgiev, D. G.; Kolev, K.; Laude, L. D.; Mednikarov, B.; Starbov, N.

    1998-01-01

    Amorphous alumina layers are deposited on a single crystal Si substrate by a e-gun evaporation technique. These films are then thermally annealed in oxygen to be crystallized and, further, irradiated with an excimer laser beam. At each stage of the film preparation, an x-ray photoelectron spectroscopy analysis is performed at the film surface and in depth, upon ion beam grinding. Results give evidence for the formation of an aluminosilicate upon thermal annealing of the film in oxygen. At the surface itself, this compound is observed to decompose upon excimer laser irradiation at energy densities exceeding 1.75 J/cm2, giving rise to free Si atoms and SiO2, however with complete disappearance of Al atoms. Model photochemical reactions are proposed to explain such transformations.

  3. Determination of band profiles in GaN films using hard X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Saito, Shinji; Yoshiki, Masahiko; Nunoue, Shinya; Sano, Nobuyuki

    2017-02-01

    We investigated band-profile control by introducing interlayers between a semiconductor and metal contact layers to improve the electrical properties of GaN-based semiconductor devices. We evaluated the electronic structure of the semiconductor surface and the metal/semiconductor interface by hard X-ray photoelectron spectroscopy. We also performed Monte Carlo simulations using the Boltzmann transport equation under the potential profile obtained using the Poisson equation. The band profile in the semiconductor substrate was then examined by comparing the energy spectra from the simulations with those from the experiments. We obtained good agreement between the two results. The present experimental and theoretical methods allow one to determine the band profile near the surface of a semiconductor as well as that in a metal interface. This approach may become a useful tool in the design and/or evaluation of processing conditions.

  4. Core-Hole Molecular Frame X-Ray Photoelectron Angular Distributions as Molecular Geometry Probes

    NASA Astrophysics Data System (ADS)

    Trevisan, Cynthia; Williams, Joshua; Menssen, Adrian; Weber, Thorsten; Rescigno, Thomas; McCurdy, Clyde; Landers, Allen

    2014-05-01

    We present experimental and theoretical results for the angular dependence of electrons ejected from the core orbitals of ethane (C2H6) and tetrafluoromethane (CF4) in an effort to understand the origin of the imaging effect by which the molecular frame photoelectron angular distributions (MFPADs) for removing an electron from a 1s orbital effectively image the geometry of a class of molecules. At low energies, our calculations predict the same imaging effect in X2H6 previously found in CH4, H2O and NH3. By contrast, in experiment and calculations CF4 displays an anti-imaging effect, whereby the electron ejected by core photoionization has the tendency to avoid molecular bonds, if averaged over directions of polarization of the incident X-ray beam. Our measurements employ the COLTRIMS method and the calculations were performed with the Complex Kohn Variational method.

  5. Enzymatic modification and X-ray photoelectron spectroscopy analysis of a functionalized polydiacetylene thin film

    SciTech Connect

    Wilson, T.E.; Spevak, W.; Bednarski, M.D. Lawrence Berkeley Lab., CA ); Charych, D.H. )

    1994-05-01

    The mild conditions and specificity of biological catalysts are attractive incentives for their use in the formation of surfaces with well-defined chemical functionality. Herein, we describe the synthesis, characterization, and enzymatic modification of a functionalized polymeric bilayer assembly. The assembly is composed of a self-assembled monolayer of octadecylsilane and a Langmuir-Blodgett monolayer of polydiacetylene functionalized with the dipeptide phenylalanine-alanine (Phe-Ala). We demonstrate via X-ray photoelectron spectroscopy surface analysis that the surface-bound Phe-Ala dipeptide is a substrate for specific cleavage by the enzyme subtilisin BPN[prime]. In-situ surface transformations via enzymatic synthesis or cleavage offer an alternative to chemical treatments of organic thin films. 28 refs., 4 figs.

  6. Angularly resolved X-ray photoelectron spectroscopy investigation of PTFE after prolonged space exposure

    NASA Technical Reports Server (NTRS)

    Dalins, I.; Karimi, M.

    1992-01-01

    Monochromatized angularly resolved X-ray photoelectron spectroscopy (ARXPS) was used to study PTFE (Teflon) that had been exposed to an earth orbital environment for approximately six years. The primary interest of the research is on a very reactive component of this environment (atomic oxygen) which, because of the typical orbital velocities of a spacecraft, impinge on exposed surfaces with 5 eV energy. This presentation deals with the method of analysis, the findings as they pertain to a rather complex carbon, oxygen, and fluorine XPS peak analysis, and the character of the valence bands. An improved bias referencing method, based on ARXPS, is also demonstrated for evaluating specimen charging effects. It was found that the polymer molecule tends to resist the atomic oxygen attack by reorienting itself, so that the most electronegative CF3 groups are facing the incoming hyperthermal oxygen atoms. The implications of these findings to ground-based laboratory studies are discussed.

  7. X-ray photoelectron spectroscopy study of radiofrequency-sputtered refractory compound steel interfaces

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.; Brainard, W. A.

    1978-01-01

    Radiofrequency sputtering was used to deposit Mo2C, Mo2B5, and MoSi2 coatings on 440C steel substrates. Both sputter etched and preoxidized substrates were used, and the films were deposited with and without a substrate bias of -300 V. The composition of the coatings was measured as a function of depth by X-ray photoelectron spectroscopy combined with argon ion etching. In the interfacial region there was evidence that bias produced a graded interface in Mo2B5 but not in Mo2C. Oxides of iron and of all film constituents except carbon were presented in all cases but the iron oxide concentration was higher and the layer thicker on the preoxidized substrates. The film and iron oxides were mixed in the MoSi2 and Mo2C films but layered in the Mo2B5 film. The presence of mixed oxides correlates with enhanced film adhesion.

  8. Probing hot-electron effects in wide area plasmonic surfaces using X-ray photoelectron spectroscopy

    SciTech Connect

    Ayas, Sencer; Cupallari, Andi; Dana, Aykutlu

    2014-12-01

    Plasmon enhanced hot carrier formation in metallic nanostructures increasingly attracts attention due to potential applications in photodetection, photocatalysis, and solar energy conversion. Here, hot-electron effects in nanoscale metal-insulator-metal (MIM) structures are investigated using a non-contact X-ray photoelectron spectroscopy based technique using continuous wave X-ray and laser excitations. The effects are observed through shifts of the binding energy of the top metal layer upon excitation with lasers of 445, 532, and 650 nm wavelength. The shifts are polarization dependent for plasmonic MIM grating structures fabricated by electron beam lithography. Wide area plasmonic MIM surfaces fabricated using a lithography free route by the dewetting of evaporated Ag on HfO{sub 2} exhibit polarization independent optical absorption and surface photovoltage. Using a simple model and making several assumptions about the magnitude of the photoemission current, the responsivity and external quantum efficiency of wide area plasmonic MIM surfaces are estimated as 500 nA/W and 11 × 10{sup −6} for 445 nm illumination.

  9. Electronic structure of fluorinated multiwalled carbon nanotubes studied using x-ray absorption and photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Brzhezinskaya, M. M.; Muradyan, V. E.; Vinogradov, N. A.; Preobrajenski, A. B.; Gudat, W.; Vinogradov, A. S.

    2009-04-01

    This paper presents the results of combined investigation of the chemical bond formation in fluorinated multiwalled carbon nanotubes (MWCNTs) with different fluorine contents (10-55wt%) and reference compounds (highly oriented pyrolytic graphite crystals and “white” graphite fluoride) using x-ray absorption and photoelectron spectroscopy at C1s and F1s thresholds. Measurements were performed at BESSY II (Berlin, Germany) and MAX-laboratory (Lund, Sweden). The analysis of the soft x-ray absorption and photoelectron spectra points to the formation of covalent chemical bonding between fluorine and carbon atoms in the fluorinated nanotubes. It was established that within the probing depth (˜15nm) of carbon nanotubes, the process of fluorination runs uniformly and does not depend on the fluorine concentration. In this case, fluorine atoms interact with MWCNTs through the covalent attachment of fluorine atoms to graphene layers of the graphite skeleton (phase 1) and this bonding is accompanied by a change in the hybridization of the 2s and 2p valence electron states of the carbon atom from the trigonal (sp2) to tetrahedral (sp3) hybridization and by a large electron transfer between carbon an fluorine atoms. In the MWCNT near-surface region the second fluorine-carbon phase with weak electron transfer is formed; it is located mainly within two or three upper graphene monolayers, and its contribution becomes much poorer as the probing depth of fluorinated multiwalled carbon nanotubes (F-MWCNTs) increases. The defluorination process of F-MWCNTs on thermal annealing has been investigated. The conclusion has been made that F-MWCNT defluorination without destruction of graphene layers is possible.

  10. X-ray photoelectron spectroscopy and luminescent properties of Y2O3:Bi3+ phosphor

    NASA Astrophysics Data System (ADS)

    Jafer, R. M.; Coetsee, E.; Yousif, A.; Kroon, R. E.; Ntwaeaborwa, O. M.; Swart, H. C.

    2015-03-01

    X-ray photoelectron spectroscopy (XPS) results provided proof for the blue and green emission of Bi3+ in the Y2O3:Bi3+ phosphor. The Y2O3:Bi3+ phosphor was successfully prepared by the combustion process during the investigation of down-conversion materials for Si solar cell application. The X-ray diffraction (XRD) patterns indicated that a single-phase cubic crystal structure with the Ia3 space group was formed. X-ray photoelectron spectroscopy (XPS) showed that the Bi3+ ion replaces the Y3+ ion in two different coordination sites in the Y2O3 crystal structure. The O 1s peak shows five peaks, two which correlate with the O2- ion in Y2O3 in the two different sites, two which correlate with O2- in Bi2O3 in the two different sites and the remaining peak relates to hydroxide. The Y 3d spectrum shows two peaks for the Y3+ ion in the Y2O3 structure in two different sites and the Bi 4f spectrum shows the Bi3+ ion in the two different sites in Bi2O3. The photoluminescence (PL) results showed three broad emission bands in the blue and green regions under ultraviolet excitation, which were also present for panchromatic cathodoluminescence (CL) results. These three peaks have maxima at ∼3.4, 3.0 and 2.5 eV. The PL emission ∼3.0 eV (blue emission) showed two excitation bands centered at ∼3.7 and 3.4 eV while the PL emission at ∼2.5 eV (green emission) showed a broad excitation band from ∼4 to 3.4 eV. The panchromatic CL images were obtained for selected wavelengths at (2.99 ± 0.08) eV (for blue emission) and (2.34 ± 0.06) eV (for green emission). These luminescence results correlate with the XPS results that show that there are two different Bi3+ sites in the host lattice.

  11. Near Edge X-Ray Absorption and X-Ray Photoelectron Diffraction Studies of the Structural Environment of Ge-Si Systems

    NASA Astrophysics Data System (ADS)

    Castrucci, P.; Gunnella, R.; Pinto, N.; Bernardini, R.; de Crescenzi, M.; Sacchi, M.

    Near edge X-ray absorption spectroscopy (XAS), X-ray photoelectron diffraction (XPD) and Auger electron diffraction (AED) are powerful techniques for the qualitative study of the structural and electronic properties of several systems. The recent development of a multiple scattering approach to simulating experimental spectra opened a friendly way to the study of structural environments of solids and surfaces. This article reviews recent X-ray absorption experiments using synchrotron radiation which were performed at Ge L edges and core level electron diffraction measurements obtained using a traditional X-ray source from Ge core levels for ultrathin Ge films deposited on silicon substrates. Thermodynamics and surface reconstruction have been found to play a crucial role in the first stages of Ge growth on Si(001) and Si(111) surfaces. Both techniques show the occurrence of intermixing processes even for room-temperature-grown Ge/Si(001) samples and give a straightforward measurement of the overlayer tetragonal distortion. The effects of Sb as a surfactant on the Ge/Si(001) interface have also been investigated. In this case, evidence of layer-by-layer growth of the fully strained Ge overlayer with a reduced intermixing is obtained when one monolayer of Sb is predeposited on the surface.

  12. GaN quantum dot polarity determination by X-ray photoelectron diffraction

    NASA Astrophysics Data System (ADS)

    Romanyuk, O.; Bartoš, I.; Brault, J.; Mierry, P. De; Paskova, T.; Jiříček, P.

    2016-12-01

    Growth of GaN quantum dots (QDs) on polar and semipolar GaN substrates is a promising technology for efficient nitride-based light emitting diodes (LED). The QDs crystal orientation typically repeats the polarity of the substrate. In case of non-polar or semipolar substrates, the polarity of QDs is not obvious. In this article, the polarity of GaN QDs and of underlying layers was investigated nondestructively by X-ray photoelectron diffraction (XPD). Polar and semipolar GaN/Al0.5Ga0.5N heterostructures were grown on the sapphire substrates with (0001) and (1 1 bar 00) orientations by molecular beam epitaxy (MBE). Polar angle dependence of N 1s core-level photoelectron intensities were measured from GaN QDs and compared with the corresponding experimental curves from free-standing GaN crystals. It is confirmed experimentally, that the crystalline orientation of polar (0001) GaN QDs follows the orientation of the (0001) sapphire substrate. In case of semipolar GaN QDs grown on (1 1 bar 00) sapphire substrate, the (11 2 bar 2) polarity of QDs was determined.

  13. Characterisation of crystalline C-S-H phases by X-ray photoelectron spectroscopy

    SciTech Connect

    Black, Leon; Garbev, Krassimir; Stemmermann, Peter; Hallam, Keith R.; Allen, Geoffrey C

    2003-06-01

    We have prepared a number of crystalline calcium-silicate-hydrate (C-S-H) phases hydrothermally, with calcium-silicon ratios varying from approximately 0.5 (K-phase) to 2.0 (hillebrandite and {alpha}-dicalcium silicate hydrate). The phases were then analysed using X-ray photoelectron spectroscopy (XPS). Increasing calcium-silicon ratios resulted in decreased silicon binding energies. Additionally, changes in the O 1s spectra could be explained in terms of bridging (BO) and nonbridging oxygen (NBO) moieties. Finally, the modified Auger parameter has proved particularly useful in determining the extent of silicate anion polymerisation. Of note also are the apparently unusual spectra for 11 A tobermorite. The silicon and oxygen photoelectron spectra indicate a phase with a lower degree of silicate polymerisation than predicted from its composition. The main contributing factor is the intrinsic disorder within the tobermorite structure. This study has shown how XPS may be used to obtain valuable structural information from C-S-H phases, and our analysis of the crystalline phases is the first step towards the analysis of real C-S-H-based cement systems.

  14. Reactive ZnO/Ti/ZnO interfaces studied by hard x-ray photoelectron spectroscopy

    SciTech Connect

    Knut, Ronny Lindblad, Rebecka; Rensmo, Håkan; Karis, Olof; Grachev, Sergey; Faou, Jean-Yvon; Søndergård, Elin

    2014-01-28

    The chemistry and intermixing at buried interfaces in sputter deposited ZnO/Ti/ZnO thin layers were studied by hard x-ray photoelectron spectroscopy. The long mean free path of the photoelectrons allowed for detailed studies of the oxidation state, band bending effects, and intrinsic doping of the buried interfaces. Oxidation of the Ti layer was observed when ZnO was deposited on top. When Ti is deposited onto ZnO, Zn Auger peaks acquire a metallic character indicating a strong reduction of ZnO at the interface. Annealing of the stack at 200 °C results in further reduction of ZnO and oxidation of Ti. Above 300 °C, oxygen transport from the bulk of the ZnO layer takes place, leading to re-oxidation of ZnO at the interface and further oxidation of Ti layer. Heating above 500 °C leads to an intermixing of the layers and the formation of a Zn{sub x}TiO{sub y} compound.

  15. Surface structure of lithiated graphite by X-ray photoelectron diffraction

    NASA Astrophysics Data System (ADS)

    Lee, Choong Man; Yang, S.-H.; Mun, B.-J.; Ross, Philip N.

    2001-04-01

    The surface composition and structure of a stage-one lithium intercalation compound (Li-GIC) was studied by X-ray photoelectron diffraction (XPD) from Li 1s and C 1s core levels. The Li-GIC was prepared in situ by vapor phase intercalation of lithium into highly oriented pyrolitic graphite (HOPG) in an ultra-high vacuum system. Stage-one Li-GIC, LiC 6, having a characteristic golden color, was obtained using Li evaporation onto a HOPG substrate at 400 K, while a metallic lithium overlayer was observed at depositions below room temperature. XPD patterns of Li 1s and C 1s intensities as a function of the polar emission angle were obtained at a fixed photon energy of 1253.6 eV. The experimental XPD patterns on the HOPG and the stage-one Li-GIC were both in quite good agreement with calculated XPD patterns based on Rehr-Albers separable representation for scattering of the emitted photoelectrons. The structural model for the surface of the Li-GIC producing the best fit to the experimental data has the bulk LiC 6 lattice with surface termination in the graphene plane.

  16. X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of CaSO 4:Dy thermoluminescent phosphors

    NASA Astrophysics Data System (ADS)

    Bakshi, A. K.; Jha, S. N.; Olivi, L.; Phase, D. M.; Kher, R. K.; Bhattacharyya, D.

    2007-11-01

    Extended X-ray absorption fine structure (EXAFS) measurements have been carried out on CaSO4:Dy phosphor samples at the Dy L3 edge with synchrotron radiation. Measurements were carried out on a set of samples which were subjected to post-preparation annealing at different temperatures and for different cycles. The EXAFS data have been analysed to find the Dy-S and Dy-O bond lengths in the neighbourhood of the Dy atoms in a CaSO4 matrix. The observations from EXAFS measurements were verified with XANES and XPS techniques. On the basis of these measurements, efforts were made to explain the loss of thermoluminescence sensitivity of CaSO4:Dy phosphors after repeated cycles of annealing at 400 °C in air for 1 h.

  17. X-ray photoelectron spectra structure and chemical bond nature in NpO2

    NASA Astrophysics Data System (ADS)

    Teterin, Yu. A.; Teterin, A. Yu.; Ivanov, K. E.; Ryzhkov, M. V.; Maslakov, K. I.; Kalmykov, St. N.; Petrov, V. G.; Enina, D. A.

    2014-01-01

    Quantitative analysis was done of the x-ray photoelectron spectra structure in the binding energy (BE) range of 0 to ˜35 eV for neptunium dioxide (NpO2) valence electrons. The BEs and structure of the core electronic shells (˜35-1250 eV) as well as the relativistic discrete variation calculation results for the finite fragment of the NpO2 lattice and the data of other authors were taken into account. The experimental data show that the many-body effects and the multiplet splitting contribute to the spectral structure much less than the effects of formation of the outer (0-˜15 eV) and the inner (˜15-˜35 eV) valence molecular orbitals (OVMO and IVMO, respectively). The filled Np 5f electronic states were shown to form in the NpO2 valence band. The Np 6p electrons participate in formation of both the IVMO and the OVMO (bands). The filled Np 6p3/2 and the O 2s electronic shells were found to take the maximum part in the IVMO formation. The MO composition and the sequence order in the BE range 0-˜35 eV in NpO2 were established. The experimental and theoretical data allowed a quantitative MO scheme for NpO2, which is fundamental for both understanding the chemical bond nature in neptunium dioxide and the interpretation of other x-ray spectra of NpO2.

  18. X-ray Photoelectron Spectroscopy Study of Argon-Plasma-Treated Fluoropolymers

    NASA Technical Reports Server (NTRS)

    Golub, Morton A.; Lopata, Eugene S.; Finney, Lorie S.

    1994-01-01

    Films of poly(tetrafluoroethylene) (PTFE) and of a tetrafluoroethylene-perfluoroalkyl vinyl ether (approximately 49:1) copolymer (PFA) were exposed to a radio-frequency argon plasma and then examined by X-ray photoelectron spectroscopy (XPS). The use of fluoropolymer films nearly free of surface hydrocarbon contamination as well as the use of a monochromatized X-ray source for XPS removed two factors contributing to conflicting reports on the effect of exposure time on the fluorine-to-carbon (F/C) and oxygen-to-carbon (O/C) ratios for several Ar-plasma-treated fluoropolymers. Contrary to literature indications, a common pattern was found for PTFE and PFA: a moderate decrease in F/C ratio (from 1.99 to 1.40, and from 1.97 to 1.57, respectively), together with a moderate increase in O/C ratio (from negligible to about 0.10, and from 0.012 to about O.10, respectively) at very short exposures, after which the F/C ratios remained essentially constant on prolonged exposures, while the O/C ratios for PTFE and PFA leveled off at 0.11 and 0.15, respectively. The XPS C(sub 1s), spectra for these polymers exposed to the Ar plasma for 20 min were similar and presented, besides a prominent peak at 292.0 eV (CF2,) and a minor peak at 294.0 or 294.1 eV (CF3), a composite band of four curve-resolved peaks (approximately 285-290 eV) representing various CH, CC, CO, CN, and CF functionalities.

  19. Laboratory-based high pressure X-ray photoelectron spectroscopy: A novel and flexible reaction cell approach

    NASA Astrophysics Data System (ADS)

    Kerherve, Gwilherm; Regoutz, Anna; Bentley, David; Hood, Colin; Feeley, Keith; Knight, Stewart; Robson, Anthony; Turner, Craig; Singh, Nick; Pontefract, John; Åhlund, John; Kahk, Juhan M.; Villar-Garcia, Ignacio J.; Payne, David J.

    2017-03-01

    The last 10-15 years have witnessed a resurgence in the application of high pressure X-ray photoelectron spectroscopy, mainly through the development of new electron energy analyser designs and the utilization of high-brilliance synchrotron radiation sources. To continue this expansion of the technique, it is crucial that instruments are developed for the home-laboratory, considering that this is where the vast majority of traditional ultra-high vacuum (UHV) X-ray photoelectron spectroscopy is performed. The research presented here introduces a new addition to the field, an instrument capable of performing spectroscopy measurements from UHV to high pressure (25 mbar), achieved using a retractable and modular reaction cell design. The ease of use, stability (of analyser, X-ray source, and gas delivery, etc.), and overall capability of the instrument will be demonstrated.

  20. First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

    SciTech Connect

    Kishi, Hiroki; Miyazawa, Miki; Matsushima, Naoki; Yamauchi, Jun

    2014-02-21

    We investigate the X-ray photoelectron spectroscopy (XPS) binding energies of As 3d in Si for various defects in neutral and charged states by first-principles calculation. It is found that the complexes of a substitutional As and a vacancy in charged and neutral states explain the experimentally observed unknown peak very well.

  1. Surface composition analysis of HF vapour cleaned silicon by X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Ermolieff, A.; Martin, F.; Amouroux, A.; Marthon, S.; Westendorp, J. F. M.

    1991-06-01

    X-ray photoelectron spectroscopy (XPS) measurements on silicon surfaces treated by HF gaseous cleaning are described. Various cleaning recipes, which essentially differ by the amount of water present during the reaction were studied; the composition of the silicon surface was measured in terms of monolayer coverage of oxygen, fluorine and carbon. These gaseous cleaned surfaces are compared with those of commonly deglazed silicon samples by using an aqueous HF bath. The F(1s), O(1s), Si(2p), C(1s) photoelectron lines were monitored, and concentrations determined as usual by integration of the lines after removal of the non-linear backgroune. The F(1s), C(1s) and Si(2p) lines were decomposed into several components corresponding to different chemical bonds. The results show that the amount of fluorine is directly correlated with the amount of oxygen: the higher the oxygen level on the sample, the more important is the fluorine content till 0.7 ML, essentially in a O sbnd Si sbnd F bonding state. For more aggresive etching leaving less than one monolayer of oxygen, the Si sbnd F bond becomes predominant. The ratio of the SiF to OSiF concentrations is a significant signature of the deoxidation state of the surface. Hydrophobicity of the water appears in the range of 25% Si sbnd F bonds. With very aggresive etching processes, 67% Si sbnd F bonds and 33% O sbnd Si sbnd F bonds are reached and the total amount of fluoride drops below 0.3 ML. For comparison, only Si sbnd F bonds are observed after a wet etching in a dilute HF bath without a rinse with a much lower fluorine concentration. The balance between Si sbnd F and O sbnd Si sbnd F remains stable and seems to be representative of the surface states provided by the etching process.

  2. Closing the pressure gap in x-ray photoelectron spectroscopy by membrane hydrogenation

    SciTech Connect

    Delmelle, Renaud; Borgschulte, Andreas; Probst, Benjamin; Alberto, Roger; Züttel, Andreas; Bleiner, Davide

    2015-05-15

    Comprehensive studies of gas-solid reactions require the in-situ interaction of the gas at a pressure beyond the operating pressure of ultrahigh vacuum (UHV) X-ray photoelectron spectroscopy (XPS). The recent progress of near ambient pressure XPS allows to dose gases to the sample up to a pressure of 20 mbar. The present work describes an alternative to this experimental challenge, with a focus on H{sub 2} as the interacting gas. Instead of exposing the sample under investigation to gaseous hydrogen, the sample is in contact with a hydrogen permeation membrane, through which hydrogen is transported from the outside to the sample as atomic hydrogen. Thereby, we can reach local hydrogen concentrations at the sample inside an UHV chamber, which is equipped with surface science tools, and this corresponds to a hydrogen pressure up to 1 bar without affecting the sensitivity or energy resolution of the spectrometer. This experimental approach is validated by two examples, that is, the reduction of a catalyst precursor for CO{sub 2} hydrogenation and the hydrogenation of a water reduction catalyst for photocatalytic H{sub 2} production, but it opens the possibility of the new in situ characterisation of energy materials and catalysts.

  3. X-ray photoelectron spectroscopic study of the chemical vapor deposited W/Al interface

    NASA Astrophysics Data System (ADS)

    Ohshima, H.; Katayama, M.; Onoda, K.; Hattori, T.; Suzuki, H.; Tokuda, Y.

    1993-07-01

    The dependence of the amount of aluminum trifluoride (AlF3) piled up at the interface of chemical vapor deposited tungsten and the aluminum under layer on the deposition time and subsequent annealing in ultrahigh vacuum (UHV) or in monosilane (SiH4) gas has been studied. AlF3 is formed by the reaction of the aluminum under layer with tungsten hexafluoride (WF6) during the initial state of tungsten chemical vapor deposition. Tungsten was deposited on an Al layer under selective deposition conditions by SiH4 reduction at 250 °C. X-ray photoelectron spectroscopy measurement reveals that the amount of AlF3 decreases with an increase in the tungsten deposition time and that the reduction of AlF3 by volatilization of aluminum fluorides, which occurs at higher temperatures (≳400 °C) is not observed at low temperature (270 °C). Annealing in SiH4 gas after the tungsten deposition was effective to reduce the amount of AlF3 compared with annealing in UHV. This result and thermochemical data would suggest that the dependence of the amount of AlF3 on the tungsten deposition time is explained by the reduction of AlF3 with hydrogen atoms supplied from the dissociation of SiH4.

  4. Surface characterization of various graphites by x-ray photoelectron, secondary ion mass, and Raman spectroscopies

    SciTech Connect

    Ashida, K.; Kanamori, K.; Watanabe, K.

    1988-07-01

    Graphite is the primary candidate for the first wall of magnetically confined fusion devices. For this purpose, it is important to know the surface properties of graphite to understand the plasma--surface interactions as well as vacuum properties of graphite. From this viewpoint, we examined the binding states of carbon atoms, inherent hydrogen content, and crystallinity of the surfaces of isotropic graphites prepared by several Japanese companies as well as anisotropic ones with x-ray photoelectron (XPS), secondary ion mass (SIMS), and Raman (RS) spectroscopies. Although no measurable difference in the binding state of carbon atoms was detected among the isotropic and anisotropic graphites with XPS, RS revealed that their crystallite sizes differed from each other. Namely, the crystallite sizes of the isotropic graphites were in the range from 100 to 300 A, whereas those of the anisotropic graphites were more than approx.1000 A. In addition, nongraphitized carbon which was not observed for the anisotropic graphites was present in the surface layers of the isotropic ones. SIMS revealed that the inherent hydrogen contents in the isotropic graphites were larger than those in the anisotropic ones. The results indicate that the larger hydrogen contents in the isotropic graphites are due to the presence of nongraphitized carbon which acts as the trapping site of hydrogen atoms.

  5. Characterization of peptide attachment on silicon nanowires by X-ray photoelectron spectroscopy and mass spectrometry.

    PubMed

    Kurylo, Ievgen; Dupré, Mathieu; Cantel, Sonia; Enjalbal, Christine; Drobecq, Hervé; Szunerits, Sabine; Melnyk, Oleg; Boukherroub, Rabah; Coffinier, Yannick

    2017-03-13

    In this paper, we report an original method to immobilize a model peptide on silicon nanowires (SiNWs) via a photolinker attached to the SiNWs' surface. The silicon nanowires were fabricated by a metal assisted chemical etching (MACE) method. Then, direct characterization of the peptide immobilization on SiNWs was performed either by X-ray photoelectron spectroscopy (XPS) or by laser-desorption/ionization mass spectrometry (LDI-MS). XPS allowed us to follow the peptide immobilization and its photorelease by recording the variation of the signal intensities of the different elements present on the SiNW surface. Mass spectrometry was performed without the use of an organic matrix and peptide ions were produced via a photocleavage mechanism. Indeed, thanks to direct photorelease achieved upon laser irradiation, a recorded predictable peak related to the molecular peptide ion has been detected, allowing the identification of the model peptide. Additional MS/MS experiments confirmed the photodissociation site and confirmed the N-terminal immobilization of the peptide on SiNWs.

  6. In Situ Ambient Pressure X-ray Photoelectron Spectroscopy Studies of Lithium-Oxygen Redox Reactions

    NASA Astrophysics Data System (ADS)

    Lu, Yi-Chun; Crumlin, Ethan J.; Veith, Gabriel M.; Harding, Jonathon R.; Mutoro, Eva; Baggetto, Loïc; Dudney, Nancy J.; Liu, Zhi; Shao-Horn, Yang

    2012-10-01

    The lack of fundamental understanding of the oxygen reduction and oxygen evolution in nonaqueous electrolytes significantly hinders the development of rechargeable lithium-air batteries. Here we employ a solid-state Li4+xTi5O12/LiPON/LixV2O5 cell and examine in situ the chemistry of Li-O2 reaction products on LixV2O5 as a function of applied voltage under ultra high vacuum (UHV) and at 500 mtorr of oxygen pressure using ambient pressure X-ray photoelectron spectroscopy (APXPS). Under UHV, lithium intercalated into LixV2O5 while molecular oxygen was reduced to form lithium peroxide on LixV2O5 in the presence of oxygen upon discharge. Interestingly, the oxidation of Li2O2 began at much lower overpotentials (~240 mV) than the charge overpotentials of conventional Li-O2 cells with aprotic electrolytes (~1000 mV). Our study provides the first evidence of reversible lithium peroxide formation and decomposition in situ on an oxide surface using a solid-state cell, and new insights into the reaction mechanism of Li-O2 chemistry.

  7. Quantum-classical calculations of X-ray photoelectron spectra of polymers-Polymethyl methacrylate revisited.

    PubMed

    Löytynoja, T; Harczuk, I; Jänkälä, K; Vahtras, O; Ågren, H

    2017-03-28

    In this work, we apply quantum mechanics/molecular mechanics (QM/MM) approach to predict core-electron binding energies and chemical shifts of polymers, obtainable via X-ray photoelectron spectroscopy(XPS), using polymethyl methacrylate as a demonstration example. The results indicate that standard parametrizations of the quantum part (basis sets, level of correlation) and the molecular mechanics parts (decomposed charges, polarizabilities, and capping technique) are sufficient for the QM/MM model to be predictive for XPS of polymers. It is found that the polymer environment produces contributions to the XPS binding energies that are close to monotonous with the number of monomer units, totally amounting to approximately an eV decrease in binding energies. In most of the cases, the order of the shifts is maintained, and even the relative size of the differential shifts is largely preserved. The coupling of the internal core-hole relaxation to the polymer environment is found to be weak in each case, amounting only to one or two tenths of an eV. The main polymeric effect is actually well estimated already at the frozen orbital level of theory, which in turn implies a substantial computational simplification. These conclusions are best represented by the cases where the ionized monomer and its immediate surrounding are treated quantum mechanically. If the QM region includes only a single monomer, a couple of anomalies are spotted, which are referred to the QM/MM interface itself and to the neglect of a possible charge transfer.

  8. Study on NiO/Fe interface with X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Feng, Chun; Zhang, Jing-Yan; Teng, Jiao; Wang, Fu-Ming

    2010-12-01

    Different monolayers (ML) of Fe atoms were deposited on NiO (001) substrates or NiO underlayers using molecular beam epitaxy (MBE), pulse laser deposition (PLD), and magnetron sputtering (MS). The magnetic properties and microstructure of the films were studied. The apparent magnetic dead layer (MDL) is found to exist at the NiO/Fe interfaces of the MBE sample (about 2 ML MDL), the PLD sample (about 3 ML MDL), and the MS sample (about 4 ML MDL). X-ray photoelectron spectroscopy indicates the presence of ionic Fe (Fe2+ or Fe3+) and metallic Ni at the NiO/Fe interfaces, which may be due to the chemical reactions between Fe and NiO layers. This also leads to the formation of MDL. The thickness of the MDL and the reaction products are related with the deposition energy of the atoms on the substrates. The interfacial reactions are effectively suppressed by inserting a thin Pt layer at the NiO/Fe interface.

  9. Analysis of Band Offset in GaNAs/GaAs by X-Ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Kitatani, Takeshi; Kondow, Masahiko; Kikawa, Takeshi; Yazawa, Yoshiaki; Okai, Makoto; Uomi, Kazuhisa

    1999-09-01

    We used X-ray photoelectron spectroscopy (XPS) to measure the energy discontinuity in the valence band (ΔEv) of Ga1-xNxAs/AlAs (x=0, 0.014, 0.034) and estimated ΔEv of GaNAs/GaAs by using the Al2p energy level as a reference. The change in ΔEv for GaNAs/GaAs with an increasing nitrogen content was -(0.019±0.053) eV/%N. This suggests that the valence-band edge (Ev) in GaNAs decreases in proportion to the nitrogen content. Based on the decrease in the bandgap energy of GaNAs, we found that the energy discontinuity in the conduction band (ΔEc) of GaNAs/GaAs is -(0.175±0.053) eV/%N. This large effect of bandgap bowing on the conduction band indicates that an ideal carrier confinement in the well can be obtained by using GaInNAs as an active layer in long-wavelength laser diodes.

  10. Characterization of oxidized platinum surfaces by X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Peuckert, M.; Bonzel, H. P.

    1984-09-01

    Various adlayers were grown on the (111) surface of a platinum crystal by four different oxidizing treatments. The resulting surface phases were characterized by X-ray photoelectron spectroscopy. According to the Pt 4f and O 1s XPS spectra, treatment in 0.1 MPa O 2 at 900 K yielded about two monolayers of PtO 2; anodic polarization in 0.5M H 2SO 4 acid electrolyte at 3 V versus standard hydrogen electrode gave a thick (> 5 nm) layer of Pt(OH) 4, while by polarization in 1M NaOH base electrolyte at 3 V versus Ag/AgCl reference electrode a thick film of an oxyhydroxide (approximately PtO(OH) 2) was formed. Etching in boiling conc. HNO 3 led to a thin layer of about 1 nm of a hydrated oxide, PtO 2 · xH 2O. Identification of the different surface phases was supported by comparative experiments with bulk PtO 2. The thermal stability of all compounds was investigated by heating the samples in ultrahigh vacuum. They all decomposed at about 400 K. Initially, not a pure metal phase was formed, but a mixed phase containing Pt metal and oxide, which was stable over a wide temperature range. No oxygen could be detected on the surface at 1070 K by XPS or Auger spectroscopy.

  11. X-ray photoelectron spectroscopic investigation of nanocrystalline calcium silicate hydrates synthesised by reactive milling

    SciTech Connect

    Black, Leon . E-mail: l.black@shu.ac.uk; Garbev, Krassimir; Beuchle, Guenter; Stemmermann, Peter; Schild, Dieter

    2006-06-15

    X-ray photoelectron spectroscopy (XPS) has been used to analyse a series of mechanochemically synthesised, nanocrystalline calcium silicate hydrates (C-S-H). The samples, with Ca/Si ratios of 0.2 to 1.5, showed structural features of C-S-H(I). XPS analysis revealed changes in the extent of silicate polymerisation. Si 2p, Ca 2p and O 1s spectra showed that, unlike for the crystalline calcium silicate hydrate phases studied previously, there was no evidence of silicate sheets (Q{sup 3}) at low Ca/Si ratios. Si 2p and O 1s spectra indicated silicate depolymerisation, expressed by decreasing silicate chain length, with increasing C/S. In all spectra, peak narrowing was observed with increasing Ca/Si, indicating increased structural ordering. The rapid changes of the slope of FWHM of Si 2p, {delta} {sub Ca-Si} and {delta} {sub NBO-BO} as function of C/S ratio indicated a possible miscibility gap in the C-S-H-solid solution series between C/S 5/6 and 1. The modified Auger parameter ({alpha}') of nanocrystalline C-S-H decreased with increasing silicate polymerisation, a trend already observed studying crystalline C-S-H. Absolute values of {alpha}' were shifted about - 0.7 eV with respect to crystalline phases of equal C/S ratio, due to reduced crystallinity.

  12. Effect of Space Radiation Processing on Lunar Soil Surface Chemistry: X-Ray Photoelectron Spectroscopy Studies

    NASA Technical Reports Server (NTRS)

    Dukes, C.; Loeffler, M.J.; Baragiola, R.; Christoffersen, R.; Keller, J.

    2009-01-01

    Current understanding of the chemistry and microstructure of the surfaces of lunar soil grains is dominated by a reference frame derived mainly from electron microscopy observations [e.g. 1,2]. These studies have shown that the outermost 10-100 nm of grain surfaces in mature lunar soil finest fractions have been modified by the combined effects of solar wind exposure, surface deposition of vapors and accretion of impact melt products [1,2]. These processes produce surface-correlated nanophase Feo, host grain amorphization, formation of surface patinas and other complex changes [1,2]. What is less well understood is how these changes are reflected directly at the surface, defined as the outermost 1-5 atomic monolayers, a region not easily chemically characterized by TEM. We are currently employing X-ray Photoelectron Spectroscopy (XPS) to study the surface chemistry of lunar soil samples that have been previously studied by TEM. This work includes modification of the grain surfaces by in situ irradiation with ions at solar wind energies to better understand how irradiated surfaces in lunar grains change their chemistry once exposed to ambient conditions on earth.

  13. Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

    NASA Astrophysics Data System (ADS)

    Avila, A.; Montero, I.; Galán, L.; Ripalda, J. M.; Levy, R.

    2001-01-01

    Thin silicon carbide films have been deposited by chemical vapor deposition on p-type (100) silicon substrates. The composition and bonds formed in these films have been analyzed by x-ray photoelectron spectroscopy (XPS) and infrared spectroscopy. The native surface oxide on the silicon carbide surface induced by air exposure has also been studied. Several phases are detected in the near-surface region: elemental Si, Si oxides (mainly SiO2), Si carbide (SiC) and Si oxicarbides (SiOxCy). Quantitative XPS analysis results indicate that, for atomic oxygen fractions <0.15, the Si-C phases are dominant in the films. Above this value no silicon oxicarbide is observed, but a multiphase material formed by elemental Si, Si oxides and Si carbides is observed. In spite of the film being a complex phase mixture, a simple relationship is found between the overall carbon and oxygen compositions. The carbon atomic fraction in the film decreases quasilinearly as the oxygen content increases, with a slope of about -1. An overall composition of SiOxC3-x in the 0.5

  14. CHARACTERIZING SURFACE LAYERS IN NITINOL USING X-RAY PHOTOELECTRON SPECTROSCOPY

    SciTech Connect

    Christopfel, R.; Mehta, A.

    2008-01-01

    Nitinol is a shape memory alloy whose properties allow for large reversible deformations and a return to its original geometry. This nickel-titanium (NiTi) alloy has become a material used widely in the biomedical fi eld as a stent to open up collapsed arteries. Both ambient and biological conditions cause surface oxidation in these devices which in turn change its biocompatibility. The thickness of oxidized layers can cause fractures in the material if too large and can allow for penetration if too thin. Depending on the type and abundance of the chemical species on or near the surface, highly toxic metal ions can leak into the body causing cell damage or even cell death. Thus, biocompatibility of such devices is crucial. By using highly surface sensitive x-ray photoelectron spectroscopy to probe the surface of these structures, it is possible to decipher both layer composition and layer thickness. Two samples, both of which were mechanically polished, were investigated. Of the two samples, one was then exposed to a phosphate buffered saline (PBS) solution to mimic the chemical properties of blood, while the other remained unexposed. Although both samples were found to have oxide layers of appropriate thickness (on the order of a few nm), it was found that the sample exposed to the saline solution had a slightly thicker oxide layer and more signifi cantly, a phosphate layer very near the surface suggesting toxic metal components are well contained within the sample. These are considerable indications of a biocompatible device.

  15. Hydrazine reduction of transition metal oxides - In situ characterization using X-ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Littrell, D. M.; Tatarchuk, B. J.

    1986-01-01

    The transition metal oxides (TMOs) V2O5, FeO3, Co3O4, NiO, CuO, and ZnO were exposed to hydrazine at various pressures. The metallic surfaces were surveyed by in situ X-ray photoelectron spectroscopy to determine the irrelative rate of reduction by hydrazine. The most easily reducible oxide, CuO, could be reduced to the metallic state at room temperature and 10 to the -6th torr. The reaction is first order with respect to CuO, with an activation energy of about 35 kJ/mol. Two types of adsorption were seen to occur at 295 K: (1) a reversible component in which the measured N:Cu ratio increased to 0.60 at hydrazine pressures up to 0.5 torr, and (2) an irreversible component, with a N:Cu ratio of 0.28, which could not be removed by extended vacuum pumping. The results of this study are useful for the identification of TMO's that can be used as solid neatallizers of hydrazine spills, and for the preparation of metal surfaces for electroplating and evaporative thin-film coating.

  16. X-ray photoelectron spectroscopy of select multi-layered transition metal carbides (MXenes)

    SciTech Connect

    Halim, Joseph; Cook, Kevin M.; Naguib, Michael; Eklund, Per; Gogotsi, Yury; Rosen, Johanna; Barsoum, Michel W.

    2015-12-01

    A detailed high resolution X-ray photoelectron spectroscopy (XPS) analysis is presented in this work for select MXenes—a recently discovered family of two-dimensional (2D) carbides and carbonitrides. Given their 2D nature, understanding their surface chemistry is paramount. Thus we identify and quantify the surface groups present before, and after, sputter-cleaning as well as freshly prepared vs. aged multi-layered cold pressed discs. The nominal compositions of the MXenes studied here are Ti3C2Tx, Ti2CTx, Ti3CNTx, Nb2CTx and Nb4C3Tx, where T represents surface groups that this work attempts to quantify. In all the cases, the presence of three surface terminations, single bondO, single bondOH and single bondF, in addition to OH-terminations relatively strongly bonded to H2O molecules, was confirmed. Moreover, from XPS peak fits, it was possible to establish the average sum of the negative charges of the terminations for the aforementioned MXenes. Based on this work, it is now possible to quantify the nature of the surface terminations. This information can, in turn, be used to better design and tailor these novel 2D materials for various applications.

  17. X-ray photoelectron spectroscopy of select multi-layered transition metal carbides (MXenes)

    DOE PAGES

    Halim, Joseph; Cook, Kevin M.; Naguib, Michael; ...

    2015-12-01

    A detailed high resolution X-ray photoelectron spectroscopy (XPS) analysis is presented in this work for select MXenes—a recently discovered family of two-dimensional (2D) carbides and carbonitrides. Given their 2D nature, understanding their surface chemistry is paramount. Thus we identify and quantify the surface groups present before, and after, sputter-cleaning as well as freshly prepared vs. aged multi-layered cold pressed discs. The nominal compositions of the MXenes studied here are Ti3C2Tx, Ti2CTx, Ti3CNTx, Nb2CTx and Nb4C3Tx, where T represents surface groups that this work attempts to quantify. In all the cases, the presence of three surface terminations, single bondO, single bondOHmore » and single bondF, in addition to OH-terminations relatively strongly bonded to H2O molecules, was confirmed. Moreover, from XPS peak fits, it was possible to establish the average sum of the negative charges of the terminations for the aforementioned MXenes. Based on this work, it is now possible to quantify the nature of the surface terminations. This information can, in turn, be used to better design and tailor these novel 2D materials for various applications.« less

  18. X-ray photoelectron spectroscopy as a probe of rhodium-ligand interaction in ionic liquids

    NASA Astrophysics Data System (ADS)

    Men, Shuang; Lovelock, Kevin R. J.; Licence, Peter

    2016-02-01

    We use X-ray photoelectron spectroscopy (XPS) to identify the interaction between the rhodium atom and phosphine ligands in six 1-octyl-3-methylimidazolium-based ionic liquids ([C8C1Im][X]). The formation of a mono-phosphine rhodium complex based upon addition of triphenylphosphine (PPh3) is confirmed by XPS in all ionic liquids studied herein. Due to the electron donation effect of the ligand, the rhodium atom becomes more negatively charged and thus exhibits a lower measured binding energy. The influence of the anion basicity on the formation of different types of rhodium complexes is also investigated. By introducing a biphosphine ligand, a chelated diphosphine rhodium complex is formed in ionic liquids with more basic anions and verified by both XPS and Infrared Spectroscopy (IR). The measured Rh 3d binding energies are correlated to the reaction selectivity of a hydroformylation reaction which inspires a method to design a metal catalyst to control the chemical reaction towards desired products in the future.

  19. [Characterization of biochar by X-ray photoelectron spectroscopy and 13C nuclear magnetic resonance].

    PubMed

    Xu, Dong-yu; Jin, Jie; Yan, Yu; Han, Lan-fang; Kang, Ming-jie; Wang, Zi-ying; Zhao, Ye; Sun, Ke

    2014-12-01

    The wood (willow branch) and grass (rice straw) materials were pyrolyzed at different temperatures (300, 450 and 600 °C) to obtain the biochars used in the present study. The biochars were characterized using elementary analysis, X-ray photoelectron spectroscopy (XPS) and solid state 13C cross-polarization and magic angle spinning nuclear magnetic resonance spectroscopy (13C NMR) to illuminate the structure and composition of the biochars which were derived from the different thermal temperatures and biomass. The results showed that the H/C, O/C and (O+N)/C ratios of the biochars decreased with the increase in the pyrolysis temperatures. The surface polarity and ash content of the grass-derived biochars were higher than those of the wood-derived biochars. The minerals of the wood-derived biochars were mainly covered by the organic matter; in contrast, parts of the mineral surfaces of the grass-derived biochars were not covered by organic matter? The 13C NMR of the low temperature-derived biochars revealed a large contribution of aromatic carbon, aliphatic carbon, carboxyl and carbonyl carbon, while the high temperature-derived biochars contained a large amount of aromatic carbon. Moreover, the wood-derived biochars produced at low heat treatment temperatures contained more lignin residues than grass-derived ones, probably due to the existence of high lignin content in the feedstock soures of wood-derived biochars. The results of the study would be useful for environmental application of biochars.

  20. A versatile instrument for ambient pressure x-ray photoelectron spectroscopy: The Lund cell approach

    NASA Astrophysics Data System (ADS)

    Knudsen, Jan; Andersen, Jesper N.; Schnadt, Joachim

    2016-04-01

    During the past one and a half decades ambient pressure x-ray photoelectron spectroscopy (APXPS) has grown to become a mature technique for the real-time investigation of both solid and liquid surfaces in the presence of a gas or vapour phase. APXPS has been or is being implemented at most major synchrotron radiation facilities and in quite a large number of home laboratories. While most APXPS instruments operate using a standard vacuum chamber as the sample environment, more recently new instruments have been developed which focus on the possibility of custom-designed sample environments with exchangeable ambient pressure cells (AP cells). A particular kind of AP cell solution has been driven by the development of the APXPS instrument for the SPECIES beamline of the MAX IV Laboratory: the solution makes use of a moveable AP cell which for APXPS measurements is docked to the electron energy analyser inside the ultrahigh vacuum instrument. Only the inner volume of the AP cell is filled with gas, while the surrounding vacuum chamber remains under vacuum conditions. The design enables the direct connection of UHV experiments to APXPS experiments, and the swift exchange of AP cells allows different custom-designed sample environments. Moreover, the AP cell design allows the gas-filled inner volume to remain small, which is highly beneficial for experiments in which fast gas exchange is required. Here we report on the design of several AP cells and use a number of cases to exemplify the utility of our approach.

  1. Chemical functionalization of nanodiamond by amino groups: an X-ray photoelectron spectroscopy study.

    PubMed

    Dhanak, V R; Butenko, Yu V; Brieva, A C; Coxon, P R; Alves, L; Siller, L

    2012-04-01

    The development of chemical functionalization techniques for diamond nanocrystallites opens up ways with a view to altering their solubility in different solvents, improve interfacial adhesion of nanodiamonds with a composite matrix in new materials, and provide new possibilities for the modification of the electronic properties of nanodiamond crystallites. In this work, we present results on the chemical functionalization of nanodiamonds by amino groups using ammonia as a nitrogenation agent. Nanodiamond material used was formed by the detonation technique with average crystallite sizes of 4-5 nm. The final materials and intermediates products were characterized by Fourier transform infrared spectroscopy (FTIR) and X-ray photoelectron spectroscopy (XPS). Chemical functionalization of nanodiamonds by amino groups could enable the preparation of new nylon nano-composite materials. Presence of surface amino groups could alter pH of nanodiamond colloids towards basic values and improve colloidal stability of nanodiamond suspensions at pH close to 7. This could enable syntheses of new drug delivery systems based on nanodiamonds.

  2. In Situ Ambient Pressure X-ray Photoelectron Spectroscopy Studies of Lithium-Oxygen Redox Reactions

    PubMed Central

    Lu, Yi-Chun; Crumlin, Ethan J.; Veith, Gabriel M.; Harding, Jonathon R.; Mutoro, Eva; Baggetto, Loïc; Dudney, Nancy J.; Liu, Zhi; Shao-Horn, Yang

    2012-01-01

    The lack of fundamental understanding of the oxygen reduction and oxygen evolution in nonaqueous electrolytes significantly hinders the development of rechargeable lithium-air batteries. Here we employ a solid-state Li4+xTi5O12/LiPON/LixV2O5 cell and examine in situ the chemistry of Li-O2 reaction products on LixV2O5 as a function of applied voltage under ultra high vacuum (UHV) and at 500 mtorr of oxygen pressure using ambient pressure X-ray photoelectron spectroscopy (APXPS). Under UHV, lithium intercalated into LixV2O5 while molecular oxygen was reduced to form lithium peroxide on LixV2O5 in the presence of oxygen upon discharge. Interestingly, the oxidation of Li2O2 began at much lower overpotentials (~240 mV) than the charge overpotentials of conventional Li-O2 cells with aprotic electrolytes (~1000 mV). Our study provides the first evidence of reversible lithium peroxide formation and decomposition in situ on an oxide surface using a solid-state cell, and new insights into the reaction mechanism of Li-O2 chemistry. PMID:23056907

  3. Chemistry of carbon polymer composite electrode - An X-ray photoelectron spectroscopy study

    NASA Astrophysics Data System (ADS)

    Andersen, Shuang Ma; Dhiman, Rajnish; Skou, Eivind

    2015-01-01

    Surface chemistry of the electrodes in a proton exchange membrane fuel cell is of great importance for the cell performance. Many groups have reported that electrode preparation condition has a direct influence on the resulting electrode properties. In this work, the oxidation state of electrode components and the composites (catalyst ionomer mixtures) in various electrode structures were systematically studied with X-ray photoelectron spectroscopy (XPS). Based on the spectra, when catalyst is physically mixed with Nafion ionomer, the resulting electrode surface chemistry is a combination of the two components. When the electrode is prepared with a lamination procedure, the ratio between fluorocarbon and graphitic carbon is decreased. Moreover, ether type oxide content is decreased although carbon oxide is slightly increased. This indicates structure change of the catalyst layer due to an interaction between the ionomer and the catalyst and possible polymer structural change during electrode fabrication. The surface of micro porous layer was found to be much more influenced by the lamination, especially when it is in contact with catalysts in the interphase. Higher amount of platinum oxide was observed in the electrode structures (catalyst ionomer mixture) compared to the catalyst powder. This also indicates a certain interaction between the functional groups in the polymer and platinum surface.

  4. Adsorption of 2-propanol on ice probed by ambient pressure X-ray photoelectron spectroscopy

    DOE PAGES

    Newberg, John T.; Bluhm, Hendrik

    2015-08-18

    The interaction of 2-propanol with ice was examined via ambient pressure X-ray photoelectron spectroscopy (APXPS), a surface sensitive technique that probes the adsorbed 2-propanol directly with submonolayer resolution. Isothermal uptake experiments were performed on vapor deposited ice at 227 K in the presence of the equilibrium water vapor pressure of 0.05 Torr and 2-propanol partial pressures ranging from 5 × 10-5 to 2 × 10-3 Torr. The C 1s APXPS spectra of adsorbed 2-propanol showed two characteristic peaks associated with the COH alcohol group and CMe methyl groups in a 1 : 2 ratio, respectively. Coverage increased with 2-propanol partialmore » pressure and followed first order Langmuir kinetics with a Langmuir constant of K = 6.3 × 103 Torr-1. The 1 : 2 ratio of COH : CMe remained constant with increasing coverage, indicating there is no chemical reaction upon adsorption. The observed Langmuir kinetics using APXPS is consistent with previous observations of other small chain alcohols via indirect adsorption methods using, e.g., Knudsen cell and coated wall flow tube reactors.« less

  5. Adsorption of 2-propanol on ice probed by ambient pressure X-ray photoelectron spectroscopy

    SciTech Connect

    Newberg, John T.; Bluhm, Hendrik

    2015-08-18

    The interaction of 2-propanol with ice was examined via ambient pressure X-ray photoelectron spectroscopy (APXPS), a surface sensitive technique that probes the adsorbed 2-propanol directly with submonolayer resolution. Isothermal uptake experiments were performed on vapor deposited ice at 227 K in the presence of the equilibrium water vapor pressure of 0.05 Torr and 2-propanol partial pressures ranging from 5 × 10-5 to 2 × 10-3 Torr. The C 1s APXPS spectra of adsorbed 2-propanol showed two characteristic peaks associated with the COH alcohol group and CMe methyl groups in a 1 : 2 ratio, respectively. Coverage increased with 2-propanol partial pressure and followed first order Langmuir kinetics with a Langmuir constant of K = 6.3 × 103 Torr-1. The 1 : 2 ratio of COH : CMe remained constant with increasing coverage, indicating there is no chemical reaction upon adsorption. The observed Langmuir kinetics using APXPS is consistent with previous observations of other small chain alcohols via indirect adsorption methods using, e.g., Knudsen cell and coated wall flow tube reactors.

  6. Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization

    SciTech Connect

    Stoupin, Stanislav

    2016-01-25

    Electric response of an x-ray mirror enclosed in a gas flow ionization chamber was studied under the conditions of total external reflection for hard x-rays. It is shown that the electric response of the system as a function of the incidence angle is defined by x-ray Fresnel transmissivity and photon-electron attenuation properties of the mirror material. A simple interpretation of quantum yield of the system is presented. The approach could serve as a basis for non-invasive in situ diagnostics of hard x-ray optics, easy access to complementary x-ray transmissivity data in x-ray reflectivity experiments, and might also pave the way to advanced schemes for angle and energy resolving x-ray detectors.

  7. Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization

    NASA Astrophysics Data System (ADS)

    Stoupin, Stanislav

    2016-01-01

    Electric response of an x-ray mirror enclosed in a gas flow ionization chamber was studied under the conditions of total external reflection for hard x-rays. It is shown that the electric response of the system as a function of the incidence angle is defined by x-ray Fresnel transmissivity and photon-electron attenuation properties of the mirror material. A simple interpretation of quantum yield of the system is presented. The approach could serve as a basis for non-invasive in situ diagnostics of hard x-ray optics, easy access to complementary x-ray transmissivity data in x-ray reflectivity experiments, and might also pave the way to advanced schemes for angle and energy resolving x-ray detectors.

  8. ASCITOVG - FORTRAN PROGRAM FOR X-RAY PHOTOELECTRON SPECTROSCOPY DATA REFORMATTING

    NASA Technical Reports Server (NTRS)

    Able, P. B.

    1994-01-01

    It is often desirable to use a central, more powerful computer to analyze data captured on a local machine. ASCITOVG is a program for use on an IBM PC series computer which creates binary format files from columns of ASCII-format numbers. The resultant files are suitable for interactive analysis on a DEC PDP-11/73 under the Micro-RSX operating system running the VGS-5000 Enhanced Data Processing (EDP) software package. EDP performs data analysis interactively with a color graphics display, speeding up the analysis considerably when compared with batch job processing. Its interactive analysis capabilities also allow the researcher to watch for spurious data that might go undetected when some form of automatic spectrum processing is used. The incompatibility in floating-point number representations of an IBM PC and a DEC computer were resolved by a FORTRAN subroutine that correctly converts single-precision, floating-point numbers on the PC so that they can be directly read by DEC computers, such as a VAX. The subroutine also can convert binary DEC files (single-precision, floating-point numbers) to IBM PC format. This may prove a more efficient method of moving data from, for instance, a VAX-cluster down to a local IBM PC for further examination, manipulation, or display. The input data file used by ASCITOVG is simply a text file in the form of a column of ASCII numbers, with each value followed by a carriage return. These can be the output of a data collection routine or can even be keyed in through the use of a program editor. The data file header required by the EDP programs for an x-ray photoelectron spectrum is also written to the file. The spectrum parameters, entered by the user when the program is run, are coded into the header format used internally by all of the VGS-5000 series EDP packages. Any file transfer protocol having provision for binary data can be used to transmit the resulting file from the PC to the DEC machine. Each EDP data file has at least

  9. A new interpretation of the binding energies in X-ray photoelectron studies of oxides

    NASA Astrophysics Data System (ADS)

    Barr, Tery L.; Seal, Sudipta; Chen, Li Mei; Kao, Chi Chang

    1994-12-01

    Films and coatings applied to different substrates are often various types of oxides. The latter are employed for a number of reasons with particular emphasis on their lack of chemical and electrical porosity. It is generally important therefore to have some measure of the physical and chemical integrity of the resulting oxide films and their interfaces with the substrate. The latter is often realized by using X-ray photoelectron spectroscopy or electron spectroscopy for chemical analysis. In order to accomplish this, it is common practice to utilize the (now generally well accepted) binding energy data from the literature to verify and expand upon one's results. Unfortunately, close scrutiny reveals a number of major discrepancies in these literature results for certain key oxides. Thus, for example, a significant portion of the literature reports the Al 2p level of Al2O3at approximately 75.7+/-0.3 eV, whereas many others specify approximately 74.0+/-0.2 eV. Perhaps the greatest difficulty with this observation is that it can be shown that, based upon their respective methods of analysis, both results are equally valid. In the present investigation, we examine the extent and nature of this problem. We have discovered that there are particular types of oxides that exhibit this dichotomy in binding energies, whereas others do not. The role played by bonding and morphology in these differences is explored, as is the effect of the different methods of binding energy determination. Finally, we shall describe how the mechanism of the growth of oxides is the principal 'culprit' and a lack of understanding of the latter and its electronic implications may lead many to an incorrect interpretation of 'true' binding energies.

  10. Thermal desorption mass spectrometric and x-ray photoelectron studies of etched surfaces of polytetrafluoroethylene

    NASA Astrophysics Data System (ADS)

    Rye, R. R.; Kelber, J. A.

    1987-12-01

    The etching of polytetrafluoroethylene (PTFE) with Na solutions is known to lead to a loss of F, a loss which is correlated with enhanced adhesion. Subsequent heating partially restores surface F with a concurrent loss of adhesion strength. We have combined X-ray photoelectron spectroscopy (XPS) and gas phase mass spectroscopy for in situ measurements of the processes that occur as the fluorocarbon is heated. An array of volatile products, which vary with the specific treatment, desorb from etched PTFE. Among these are: N 2 and low molecular weight fluorocarbons, the amounts of which monotonically decrease with increasing exposure to the etching solution (and probably result from the bulk); species such as CO and CO 2, which in part result from surface impurities; and water and acetone which result from the rinse steps following the etching process. XPS measurements show that etching produces a major loss of surface F and a gain of surface O. The latter probably results from the subsequent rinse steps. Heating produces a substantial recovery in surface F with only a small decrease in the surface O, and the gain in surface F is shown to occur at a higher temperature than the desorption of any species from the surface. Thus, desorption of products from the surface is decoupled, in terms of both the distribution of products and their relative temperatures, from the surface changes as monitored by XPS. This decoupling suggests that the increase in surface F results from diffusion of low molecular weight fluorocarbons from the bulk or a transition region, or from a rearrangement of the sponge-like surface region produced in the etching process.

  11. X-ray photoelectron spectroscopy (XPS) investigation of the surface film on magnesium powders.

    PubMed

    Burke, Paul J; Bayindir, Zeynel; Kipouros, Georges J

    2012-05-01

    Magnesium (Mg) and its alloys are attractive for use in automotive and aerospace applications because of their low density and good mechanical properties. However, difficulty in forming magnesium and the limited number of available commercial alloys limit their use. Powder metallurgy may be a suitable solution for forming near-net-shape parts. However, sintering pure magnesium presents difficulties due to surface film that forms on the magnesium powder particles. The present work investigates the composition of the surface film that forms on the surface of pure magnesium powders exposed to atmospheric conditions and on pure magnesium powders after compaction under uniaxial pressing at a pressure of 500 MPa and sintering under argon at 600 °C for 40 minutes. Initially, focused ion beam microscopy was utilized to determine the thickness of the surface layer of the magnesium powder and found it to be ~10 nm. The X-ray photoelectron analysis of the green magnesium sample prior to sintering confirmed the presence of MgO, MgCO(3)·3H(2)O, and Mg(OH)(2) in the surface layer of the powder with a core of pure magnesium. The outer portion of the surface layer was found to contain MgCO(3)·3H(2)O and Mg(OH)(2), while the inner portion of the layer is primarily MgO. After sintering, the MgCO(3)·3H(2)O was found to be almost completely absent, and the amount of Mg(OH)(2) was also decreased significantly. This is postulated to occur by decomposition of the compounds to MgO and gases during the high temperature of sintering. An increase in the MgO content after sintering supports this theory.

  12. Band bending at ferroelectric surfaces and interfaces investigated by x-ray photoelectron spectroscopy

    SciTech Connect

    Apostol, Nicoleta Georgiana

    2014-11-24

    This work reports on the use of X-ray photoelectron spectroscopy to quantify band bending at ferroelectric free surfaces and at their interfaces with metals. Surfaces exhibiting out-of-plane ferroelectric polarization are characterized by a band bending, due to the formation of a dipole layer at the surface, composed by the uncompensated polarization charges (due to ionic displacement) and to the depolarization charge sheet of opposite sign, composed by mobile charge carriers, which migrate near surface, owing to the depolarization electric field. To this surface band bending due to out-of-plane polarization states, metal-semiconductor Schottky barriers must be considered additionally when ferroelectrics are covered by metal layers. It is found that the net band bending is not always an algebraic sum of the two effects discussed above, since sometimes the metal is able to provide additional charge carriers, which are able to fully compensate the surface charge of the ferroelectric, up to the vanishing of the ferroelectric band bending. The two cases which will be discussed in more detail are Au and Cu deposited by molecular beam epitaxy on PbZr{sub 0.2}Ti{sub 0.8}O{sub 3}(001) single crystal thin layers, prepared by pulsed laser deposition. Gold forms unconnected nanoparticles, and their effect on the band bending is the apparition of a Schottky band bending additional to the band bending due to the out-of-plane polarization. Copper, starting with a given thickness, forms continuous metal layers connected to the ground of the system, and provide electrons in sufficient quantity to compensate the band bending due to the out-of-plane polarization.

  13. Repair and Utilization of the Kratos XSAM 800 X-Ray Photoelectron Spectrometer (XPS)

    NASA Technical Reports Server (NTRS)

    Hampton, Michael D.

    2002-01-01

    The objectives for this summer faculty fellowship were first to repair the Kratos XSAM 800 X-ray Photoelectron Spectrometer (XPS) and then to utilize the instrument to participate in ongoing research projects at KSC and in the researcher's own laboratory at UCF. The first 6 weeks were used in repairing the instrument. Working both alone and with the Kratos service engineer, a number of hardware problems, largely associated with the sample stage control system, were corrected. Defective parts were identified and fixed in the computer driver boards, the stage power supply, and the driver interface. The power supply was completely replaced. After four weeks of work, the instrument was functional. This occurred on a Wednesday. The following Friday the instrument had to be completely shut down because the power to the O & C Building was to be turned off. The instrument was properly secured. On Monday, the instrument was powered up and the original problems returned. After another 2 weeks of work, a software problem was identified. This problem caused the computer to use a defective port for the sample stage control. It was circumvented by rewriting the startup routine. The final 3 weeks of the fellowship were spent using the XPS to analyze samples being studied in the Langley materials project (Martha Williams) and a catalyst project (Dr. Orlando Melendez). During this time, several sample analysis requests from other groups at KSC also came in and those samples were run as well. The summer faculty fellowship also allowed many contacts to be made. After meeting with the sensors group, two projects were identified for collaboration and white papers are being prepared. One project aims to develop small, very sensitive hydrogen detectors and the other to develop a broad area, easily monitored, zero power consumption hydrogen detector. In addition to the work mentioned above, the XPS was utilized in a study underway in Dr. Hampton's laboratory at UCF.

  14. Coordination defects in bismuth-modified arsenic selenide glasses: High-resolution x-ray photoelectron spectroscopy measurements

    SciTech Connect

    Golovchak, Roman; Shpotyuk, Oleh

    2008-05-01

    The possibility of coordination defects formation in Bi-modified chalcogenide glasses is examined by high-resolution x-ray photoelectron spectroscopy. The results provide evidence for the formation of positively charged fourfold coordinated defects on As and Bi sites in glasses with low Bi concentration. At high Bi concentration, mixed As{sub 2}Se{sub 3}-Bi{sub 2}Se{sub 3} nanocrystallites are formed in the investigated Se-rich As-Se glasses.

  15. Characterization of carbonitrided and oxidized layers on low-carbon steel by conversion electron Moessbauer spectrometry, X-ray diffractometry, and X-ray photoelectron spectrometry

    SciTech Connect

    Kurosawa, K.; Li, H.L.; Ujihira, Y.; Nomura, K.

    1999-03-01

    The structures of low-carbon steel oxidized in an aqueous saline bath at 403 K and a fused salt bath at 673 K after carbonitriding were studied using conversion electron Moessbauer spectrometry (CEMS), x-ray diffractometry (XRD), and x-ray photoelectron spectrometry (XPS). Only a doublet peak caused by poor crystallinity of iron oxyhydroxides (FeOOH) or fine particles of iron oxides such as magnetite (Fe{sub 3}O{sub 4}) and maghemite ({gamma}-Fe{sub 2}O{sub 3}) was detected in the CEMS spectra of the surface of the carbonitrided steel oxidized in the aqueous saline bath. Corrosion resistance of the carbonitrided specimens was increased by oxidizing. The oxidized layers produced in the aqueous saline bath were superior to those produced in the fused salt bath as a result of pores in the carbonitrided zone being filled with finer particles of iron oxides and the production of tight, thick oxide layers of amorphous iron oxyhydroxides or fine iron oxides. Deformation of iron nitride ({gamma}{prime}-Fe{sub 4}N) crystals in the carbonitrided zone could not be detected by oxidizing in the aqueous saline bath but were detected in the fused salt bath at 673 K.

  16. X-Ray Photoelectron Spectroscopy and the Role of Relaxation Energy in Understanding Chemical Shifts

    ERIC Educational Resources Information Center

    Ellison, Frank O.; White, Michael G.

    1976-01-01

    Discusses the measurement of electrons ejected from a system which is being irradiated with X-rays or ultraviolet photons, and a theoretical model for calculating core-electron ionization energies. (MLH)

  17. The electronic structure study of titanium-nickel alloys by x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Seabolt, Michael A.

    2002-01-01

    Purpose of the study. The purpose of the study was to investigate the electronic structure changes of titanium-nickel (Ti-Ni) alloys. The electronic structure was correlated with the physical property of shape memory effect demonstrated by 50% atomic nickel concentration Ti-Ni crystalline alloys. Methodology. The technique of x-ray photoelectron spectroscopy was used to collect spectra using an ESCA PHI 5100 system. The spectra were analyzed by measuring binding energies, Auger parameters, Shirley and Tougaard backgrounds, and electronegativity criteria. Changes in the density of state (DOS) at the Fermi level were modeled using binding energy shifts, Auger parameter changes, the intrinsic loss structure modeled from the Shirley and Tougaard background, and the electronegativity criteria. Results. Significant changes in binding energy (BE) were noted for alloys, but changes in BE could not be with electronegativity criteria. The Auger parameter demonstrated positive values for Ti and negative values for Ni with minimum values at the 50% atomic nickel concentration. This was interpreted as a transfer of charge from nickel to titanium. Wagner plots of the Auger parameter indicated Ti and Ni were in different chemical states in each of the alloys with a minimum for the 50% atomic concentration nickel, which correlates to the shape memory effect (SME). Chemical shifts indicated a shift in charge from Ni to Ti, correlating to the results yielded by the Auger parameter. Normalized background analysis (indicative of the intrinsic loss structure) obtained from Shirley and Tougaard methods correlated well with the Auger parameter and chemical shift results, indicating that background analysis is useful for studying changes in chemical state for these materials. Conclusions. This study demonstrated that BE shifts and electronegativity criteria can not be successfully used to model changes in chemical states for Ti-Ni alloys. The results from Auger parameter analysis

  18. Using “Tender” x-ray ambient pressure x-Ray photoelectron spectroscopy as a direct probe of solid-liquid interface

    DOE PAGES

    Axnanda, Stephanus; Crumlin, Ethan J.; Mao, Baohua; ...

    2015-05-07

    We report a new method to probe the solid-liquid interface through the use of a thin liquid layer on a solid surface. An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kinetic energy photoelectrons (7 keV) at a pressure up to 110 Torr has been constructed and commissioned. Additionally, we have deployed a “dip & pull” method to create a stable nanometers-thick aqueous electrolyte on platinum working electrode surface. Combining the newly constructed AP-XPS system, “dip & pull” approach, with a “tender” X-ray synchrotron source (2 keV–7 keV), we are able to access the interface between liquidmore » and solid dense phases with photoelectrons and directly probe important phenomena occurring at the narrow solid-liquid interface region in an electrochemical system. Using this approach, we have performed electrochemical oxidation of the Pt electrode at an oxygen evolution reaction (OER) potential. Under this potential, we observe the formation of both Pt²⁺ and Pt⁴⁺ interfacial species on the Pt working electrode in situ. We believe this thin-film approach and the use of “tender” AP-XPS highlighted in this study is an innovative new approach to probe this key solid-liquid interface region of electrochemistry.« less

  19. Using “Tender” x-ray ambient pressure x-Ray photoelectron spectroscopy as a direct probe of solid-liquid interface

    SciTech Connect

    Axnanda, Stephanus; Crumlin, Ethan J.; Mao, Baohua; Rani, Sana; Chang, Rui; Karlsson, Patrik G.; Edwards, Mårten O. M.; Lundqvist, Måns; Moberg, Robert; Ross, Phil; Hussain, Zahid; Liu, Zhi

    2015-05-07

    We report a new method to probe the solid-liquid interface through the use of a thin liquid layer on a solid surface. An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kinetic energy photoelectrons (7 keV) at a pressure up to 110 Torr has been constructed and commissioned. Additionally, we have deployed a “dip & pull” method to create a stable nanometers-thick aqueous electrolyte on platinum working electrode surface. Combining the newly constructed AP-XPS system, “dip & pull” approach, with a “tender” X-ray synchrotron source (2 keV–7 keV), we are able to access the interface between liquid and solid dense phases with photoelectrons and directly probe important phenomena occurring at the narrow solid-liquid interface region in an electrochemical system. Using this approach, we have performed electrochemical oxidation of the Pt electrode at an oxygen evolution reaction (OER) potential. Under this potential, we observe the formation of both Pt²⁺ and Pt⁴⁺ interfacial species on the Pt working electrode in situ. We believe this thin-film approach and the use of “tender” AP-XPS highlighted in this study is an innovative new approach to probe this key solid-liquid interface region of electrochemistry.

  20. Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface.

    PubMed

    Axnanda, Stephanus; Crumlin, Ethan J; Mao, Baohua; Rani, Sana; Chang, Rui; Karlsson, Patrik G; Edwards, Mårten O M; Lundqvist, Måns; Moberg, Robert; Ross, Phil; Hussain, Zahid; Liu, Zhi

    2015-05-07

    We report a new method to probe the solid-liquid interface through the use of a thin liquid layer on a solid surface. An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kinetic energy photoelectrons (7 keV) at a pressure up to 110 Torr has been constructed and commissioned. Additionally, we have deployed a "dip &pull" method to create a stable nanometers-thick aqueous electrolyte on platinum working electrode surface. Combining the newly constructed AP-XPS system, "dip &pull" approach, with a "tender" X-ray synchrotron source (2 keV-7 keV), we are able to access the interface between liquid and solid dense phases with photoelectrons and directly probe important phenomena occurring at the narrow solid-liquid interface region in an electrochemical system. Using this approach, we have performed electrochemical oxidation of the Pt electrode at an oxygen evolution reaction (OER) potential. Under this potential, we observe the formation of both Pt(2+) and Pt(4+) interfacial species on the Pt working electrode in situ. We believe this thin-film approach and the use of "tender" AP-XPS highlighted in this study is an innovative new approach to probe this key solid-liquid interface region of electrochemistry.

  1. Oxidation of UO 2 fuel pellets in air at 503 and 543 K studied using X-ray photoelectron spectroscopy and X-ray diffraction

    NASA Astrophysics Data System (ADS)

    Tempest, P. A.; Tucker, P. M.; Tyler, J. W.

    1988-02-01

    An understanding of the low temperature oxidation behaviour of UO 2 pellets in air is important in the unlikely event of gas ingress to a fuel can during handling or storage. The main parameter of concern is the production time of U 3O 8 particulate as a function of temperature. Factors which affect the UO2 → U3O8 transformation have been investigated by sequentially oxidising UO 2 fuel pellets in air at 503 and 543 K and monitoring the growth of U 3O and U 3O 7 using X-ray photoelectron spectroscopy, X-ray diffraction and scanning electron microscopy. Initially oxidation proceeded at a linear rate by the inward diffusion of oxygen to form a complete layer of substoichiometric U 3O 7. This phase was tetragonal with a {c}/{a} ratio of 1.015, significantly less than the value of 1.03 measured on UO 2 powder when oxidised under identical conditions. This difference and the preferred orientation exhibited by surface grains were caused by growth stresses induced in the pellet surface. Both intergranular and transgranular cracking occurred and became nucleation sites for the growth of U 3O 8. The linear oxidation period associated with U 3O 7 growth was much shorter at 543 than at 503 K and U 3O 8 nucleated earlier. Spallation and the production of particulate were only observed during the formation of U 3O 8 when a 30% increase in volume arose from the U3O7 → U3O8 phase change.

  2. Time-resolved x-ray photoelectron spectroscopy techniques for real-time studies of interfacial charge transfer dynamics

    NASA Astrophysics Data System (ADS)

    Shavorskiy, Andrey; Cordones, Amy; Vura-Weis, Josh; Siefermann, Katrin; Slaughter, Daniel; Sturm, Felix; Weise, Fabian; Bluhm, Hendrik; Strader, Matthew; Cho, Hana; Lin, Ming-Fu; Bacellar, Camila; Khurmi, Champak; Hertlein, Marcus; Guo, Jinghua; Tyliszczak, Tolek; Prendergast, David; Coslovich, Giacomo; Robinson, Joseph; Kaindl, Robert A.; Schoenlein, Robert W.; Belkacem, Ali; Weber, Thorsten; Neumark, Daniel M.; Leone, Stephen R.; Nordlund, Dennis; Ogasawara, Hirohito; Nilsson, Anders R.; Krupin, Oleg; Turner, Joshua J.; Schlotter, William F.; Holmes, Michael R.; Heimann, Philip A.; Messerschmidt, Marc; Minitti, Michael P.; Beye, Martin; Gul, Sheraz; Zhang, Jin Z.; Huse, Nils; Gessner, Oliver

    2013-04-01

    X-ray based spectroscopy techniques are particularly well suited to gain access to local oxidation states and electronic dynamics in complex systems with atomic pinpoint accuracy. Traditionally, these techniques are applied in a quasi-static fashion that usually highlights the steady-state properties of a system rather than the fast dynamics that often define the system function on a molecular level. Novel x-ray spectroscopy techniques enabled by free electron lasers (FELs) and synchrotron based pump-probe schemes provide the opportunity to monitor intramolecular and interfacial charge transfer processes in real-time and with element and chemical specificity. Two complementary time-domain xray photoelectron spectroscopy techniques are presented that are applied at the Linac Coherent Light Source (LCLS) and the Advanced Light Source (ALS) to study charge transfer processes in N3 dye-sensitized ZnO semiconductor nanocrystals, which are at the heart of emerging light-harvesting technologies.

  3. Time-resolved x-ray photoelectron spectroscopy techniques for real-time studies of interfacial charge transfer dynamics

    SciTech Connect

    Shavorskiy, Andrey; Hertlein, Marcus; Guo Jinghua; Tyliszczak, Tolek; Cordones, Amy; Vura-Weis, Josh; Siefermann, Katrin; Slaughter, Daniel; Sturm, Felix; Weise, Fabian; Khurmi, Champak; Belkacem, Ali; Weber, Thorsten; Gessner, Oliver; Bluhm, Hendrik; Strader, Matthew; Cho, Hana; Coslovich, Giacomo; Kaindl, Robert A.; Lin, Ming-Fu; and others

    2013-04-19

    X-ray based spectroscopy techniques are particularly well suited to gain access to local oxidation states and electronic dynamics in complex systems with atomic pinpoint accuracy. Traditionally, these techniques are applied in a quasi-static fashion that usually highlights the steady-state properties of a system rather than the fast dynamics that often define the system function on a molecular level. Novel x-ray spectroscopy techniques enabled by free electron lasers (FELs) and synchrotron based pump-probe schemes provide the opportunity to monitor intramolecular and interfacial charge transfer processes in real-time and with element and chemical specificity. Two complementary time-domain xray photoelectron spectroscopy techniques are presented that are applied at the Linac Coherent Light Source (LCLS) and the Advanced Light Source (ALS) to study charge transfer processes in N3 dye-sensitized ZnO semiconductor nanocrystals, which are at the heart of emerging light-harvesting technologies.

  4. An X-ray photoelectron spectroscopy study of the hydration of C{sub 2}S thin films

    SciTech Connect

    Rheinheimer, Vanessa; Casanova, Ignasi

    2014-06-01

    Electron-beam evaporation was used to produce thin films of β-dicalcium silicate. Chemical and mineralogical compositions were characterized by X-ray photoelectron spectroscopy (XPS) and grazing-angle X-ray diffraction (GAXRD), respectively. Results show that no fractionation occurs during evaporation and isostructural condensation of the material as synthesized films have the same composition as the initial bulk material. Samples were gradually hydrated under saturated water spray conditions and analyzed with XPS. Polymerization of the silicate chains due to hydration, and subsequent formation of C-S-H, has been monitored through evaluation of energy shifts on characteristic silicon peaks. Quantitative analyses show changes on the surface by the reduction of the Ca/Si ratio and an increase on the difference between binding energies of bridging and non-bridging oxygen. Finally, SEM/FIB observation shows clear differences between the surface and cross section of the initial sample and the reacted sample.

  5. Single-State Electronic Structure Measurements Using Time-Resolved X-Ray Laser Induced Photoelectron Spectroscopy

    SciTech Connect

    Nelson, A J; Dunn, J; van Buuren, T; Hunter, J

    2004-11-11

    We demonstrate single-shot x-ray laser induced time-of-flight photoelectron spectroscopy on semiconductor and metal surfaces with picosecond time resolution. The LLNL COMET compact tabletop x-ray laser source provides the necessary high photon flux (>10{sup 12}/pulse), monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the city, chemical and electronic structure of these materials. Static valence band and shallow core-level photoemission spectra are presented for ambient temperature Ge(100) and polycrystalline Cu foils. Surface contamination was removed by UV ozone cleaning prior to analysis. In addition, the ultrafast nature of this technique lends itself to true single-state measurements of shocked and heated materials. Time-resolved electron time-of-flight photoemission results for ultra-thin Cu will be presented.

  6. Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources

    SciTech Connect

    Shavorskiy, Andrey; Slaughter, Daniel S.; Zegkinoglou, Ioannis; Rude, Bruce S.; Bluhm, Hendrik; Neppl, Stefan; Cryan, James P.; Siefermann, Katrin R.; Weise, Fabian; Lin, Ming-Fu; Bacellar, Camila; Ziemkiewicz, Michael P.; Fraund, Matthew W.; Khurmi, Champak; Wright, Travis W.; Schoenlein, Robert W.; Gessner, Oliver; Hertlein, Marcus P.; Tyliszczak, Tolek; Huse, Nils; and others

    2014-09-15

    An apparatus for sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy studies with pulsed and constant wave X-ray light sources is presented. A differentially pumped hemispherical electron analyzer is equipped with a delay-line detector that simultaneously records the position and arrival time of every single electron at the exit aperture of the hemisphere with ∼0.1 mm spatial resolution and ∼150 ps temporal accuracy. The kinetic energies of the photoelectrons are encoded in the hit positions along the dispersive axis of the two-dimensional detector. Pump-probe time-delays are provided by the electron arrival times relative to the pump pulse timing. An average time-resolution of (780 ± 20) ps (FWHM) is demonstrated for a hemisphere pass energy E{sub p} = 150 eV and an electron kinetic energy range KE = 503–508 eV. The time-resolution of the setup is limited by the electron time-of-flight (TOF) spread related to the electron trajectory distribution within the analyzer hemisphere and within the electrostatic lens system that images the interaction volume onto the hemisphere entrance slit. The TOF spread for electrons with KE = 430 eV varies between ∼9 ns at a pass energy of 50 eV and ∼1 ns at pass energies between 200 eV and 400 eV. The correlation between the retarding ratio and the TOF spread is evaluated by means of both analytical descriptions of the electron trajectories within the analyzer hemisphere and computer simulations of the entire trajectories including the electrostatic lens system. In agreement with previous studies, we find that the by far dominant contribution to the TOF spread is acquired within the hemisphere. However, both experiment and computer simulations show that the lens system indirectly affects the time resolution of the setup to a significant extent by inducing a strong dependence of the angular spread of electron trajectories entering the hemisphere on the retarding ratio. The scaling of the angular

  7. Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources

    NASA Astrophysics Data System (ADS)

    Shavorskiy, Andrey; Neppl, Stefan; Slaughter, Daniel S.; Cryan, James P.; Siefermann, Katrin R.; Weise, Fabian; Lin, Ming-Fu; Bacellar, Camila; Ziemkiewicz, Michael P.; Zegkinoglou, Ioannis; Fraund, Matthew W.; Khurmi, Champak; Hertlein, Marcus P.; Wright, Travis W.; Huse, Nils; Schoenlein, Robert W.; Tyliszczak, Tolek; Coslovich, Giacomo; Robinson, Joseph; Kaindl, Robert A.; Rude, Bruce S.; Ölsner, Andreas; Mähl, Sven; Bluhm, Hendrik; Gessner, Oliver

    2014-09-01

    An apparatus for sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy studies with pulsed and constant wave X-ray light sources is presented. A differentially pumped hemispherical electron analyzer is equipped with a delay-line detector that simultaneously records the position and arrival time of every single electron at the exit aperture of the hemisphere with ˜0.1 mm spatial resolution and ˜150 ps temporal accuracy. The kinetic energies of the photoelectrons are encoded in the hit positions along the dispersive axis of the two-dimensional detector. Pump-probe time-delays are provided by the electron arrival times relative to the pump pulse timing. An average time-resolution of (780 ± 20) ps (FWHM) is demonstrated for a hemisphere pass energy Ep = 150 eV and an electron kinetic energy range KE = 503-508 eV. The time-resolution of the setup is limited by the electron time-of-flight (TOF) spread related to the electron trajectory distribution within the analyzer hemisphere and within the electrostatic lens system that images the interaction volume onto the hemisphere entrance slit. The TOF spread for electrons with KE = 430 eV varies between ˜9 ns at a pass energy of 50 eV and ˜1 ns at pass energies between 200 eV and 400 eV. The correlation between the retarding ratio and the TOF spread is evaluated by means of both analytical descriptions of the electron trajectories within the analyzer hemisphere and computer simulations of the entire trajectories including the electrostatic lens system. In agreement with previous studies, we find that the by far dominant contribution to the TOF spread is acquired within the hemisphere. However, both experiment and computer simulations show that the lens system indirectly affects the time resolution of the setup to a significant extent by inducing a strong dependence of the angular spread of electron trajectories entering the hemisphere on the retarding ratio. The scaling of the angular spread with

  8. Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources.

    PubMed

    Shavorskiy, Andrey; Neppl, Stefan; Slaughter, Daniel S; Cryan, James P; Siefermann, Katrin R; Weise, Fabian; Lin, Ming-Fu; Bacellar, Camila; Ziemkiewicz, Michael P; Zegkinoglou, Ioannis; Fraund, Matthew W; Khurmi, Champak; Hertlein, Marcus P; Wright, Travis W; Huse, Nils; Schoenlein, Robert W; Tyliszczak, Tolek; Coslovich, Giacomo; Robinson, Joseph; Kaindl, Robert A; Rude, Bruce S; Ölsner, Andreas; Mähl, Sven; Bluhm, Hendrik; Gessner, Oliver

    2014-09-01

    An apparatus for sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy studies with pulsed and constant wave X-ray light sources is presented. A differentially pumped hemispherical electron analyzer is equipped with a delay-line detector that simultaneously records the position and arrival time of every single electron at the exit aperture of the hemisphere with ~0.1 mm spatial resolution and ~150 ps temporal accuracy. The kinetic energies of the photoelectrons are encoded in the hit positions along the dispersive axis of the two-dimensional detector. Pump-probe time-delays are provided by the electron arrival times relative to the pump pulse timing. An average time-resolution of (780 ± 20) ps (FWHM) is demonstrated for a hemisphere pass energy E(p) = 150 eV and an electron kinetic energy range KE = 503-508 eV. The time-resolution of the setup is limited by the electron time-of-flight (TOF) spread related to the electron trajectory distribution within the analyzer hemisphere and within the electrostatic lens system that images the interaction volume onto the hemisphere entrance slit. The TOF spread for electrons with KE = 430 eV varies between ~9 ns at a pass energy of 50 eV and ~1 ns at pass energies between 200 eV and 400 eV. The correlation between the retarding ratio and the TOF spread is evaluated by means of both analytical descriptions of the electron trajectories within the analyzer hemisphere and computer simulations of the entire trajectories including the electrostatic lens system. In agreement with previous studies, we find that the by far dominant contribution to the TOF spread is acquired within the hemisphere. However, both experiment and computer simulations show that the lens system indirectly affects the time resolution of the setup to a significant extent by inducing a strong dependence of the angular spread of electron trajectories entering the hemisphere on the retarding ratio. The scaling of the angular spread with

  9. Non-destructive depth profiling using variable kinetic energy- x-ray photoelectron spectroscopy with maximum entropy regularization

    NASA Astrophysics Data System (ADS)

    Krajewski, James J.

    This study will describe a nondestructive method to determine compositional depth profiles of thicker films using Variable Kinetic Energy X-ray Photoelectron Spectroscopy (VKE-XPS) data by applying proven regularization methods successfully used in Angle-Resolved X-ray Photoelectron Spectroscopy (AR-XPS). To demonstrate the applicability of various regularization procedures to the experimental VKE-XPS data, simulated TiO2/Si film structures of two different thicknesses and known compositional profiles were "created" and then analyzed. It is found that superior results are attained when using a maximum entropy-like method with an initial model/prior knowledge of thickness is similar to the simulated film thickness. Other regularization functions, Slopes, Curvature and Total Variance Analysis (TVA) give acceptable results when there is no prior knowledge since they do not depend on an accurate initial model. The maximum entropy algorithm is then applied to two actual films of TiO2 deposited on silicon substrate. These results will show the applicability of generating compositional depth profiles with experimental VKE-XPS data. Accuracy of the profiles is confirmed by subjecting these actual films to a variety of "alternate" analytical thin film techniques including Sputtered Angle Resolved Photoelectron Spectroscopy, Auger Electron Spectroscopy, Rutherford Backscattering Spectroscopy, Focused Ion Beam Spectroscopy, Transmission and Scanning Electron Spectroscopy and Variable Angle Spectroscopic Ellipsometry. Future work will include applying different regularizations functions to better fit the MaxEnt composition depth profile other than those described in this study.

  10. Corrosive effects of fluoride on titanium: investigation by X-ray photoelectron spectroscopy, atomic force microscopy, and human epithelial cell culturing.

    PubMed

    Stájer, Anette; Ungvári, Krisztina; Pelsoczi, István K; Polyánka, Hilda; Oszkó, Albert; Mihalik, Erzsébet; Rakonczay, Zoltán; Radnai, Márta; Kemény, Lajos; Fazekas, András; Turzó, Kinga

    2008-11-01

    High fluoride (F(-)) concentrations and acidic pH impair the corrosion resistance of titanium (Ti). Effects of F(-)-containing caries-preventive prophylactic rinses, and gels on Ti were investigated by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Human epithelial cell attachment and proliferation were investigated by dimethylthiazol-diphenyl tetrazolium bromide (MTT) and protein content assays. Aqueous 1% NaF solution (3800 ppm F(-), pH 4.5) or high (12,500 ppm) F(-) content gel (pH 4.8) strongly corroded the surface and modified its composition. XPS revealed formation of a strongly bound F(-)-containing complex (Na(2)TiF(6)). AFM indicated an increase in roughness (R(a)) of the surfaces: 10-fold for the NaF solution and smaller for the gel or a mouthwash (250 ppm F(-), pH 4.4). MTT revealed that cell attachment was significantly increased by the gel, but was not disturbed by either the mouthwash or the NaF. Cell proliferation determined by MTT decreased significantly only for the NaF-treated samples; protein content assay experiments showed no such effect. This study indicates that epithelial cell culturing results can depend on the method used, and the adverse effects of a high F(-) concentration and low pH should be considered when prophylactic gels are applied by patients with Ti implants or other dental devices.

  11. "Un-annealed and Annealed Pd Ultra-Thin Film on SiC Characterized by Scanning Probe Microscopy and X-ray Photoelectron Spectroscopy"

    NASA Technical Reports Server (NTRS)

    Lu, W. J.; Shi, D. T.; Elshot, K.; Bryant, E.; Lafate, K.; Chen, H.; Burger, A.; Collins, W. E.

    1998-01-01

    Pd/SiC has been used as a hydrogen and a hydrocarbon gas sensor operated at high temperature. UHV (Ultra High Vacuum)-Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS) techniques were applied to study the relationship between the morphology and chemical compositions for Pd ultra-thin films on SiC (less than 30 angstroms) at different annealing temperatures. Pd ultra-thin film on 6H-SiC was prepared by the RF sputtering method. The morphology from UHV-STM and AFM shows that the Pd thin film was well deposited on SiC substrate, and the Pd was partially aggregated to round shaped participates at an annealing temperature of 300 C. At 400 C, the amount of surface participates decreases, and some strap shape participates appear. From XPS, Pd2Si was formed on the surface after annealing at 300 C, and all Pd reacted with SiC to form Pd2Si after annealing at 400 C. The intensity of the XPS Pd peak decreases enormously at 400 C. The Pd film diffused into SiC, and the Schottky barrier height has almost no changes. The work shows the Pd sicilides/SiC have the same electronic properties with Pd/SiC, and explains why the Pd/SiC sensor still responds to hydrogen at high operating temperatures.

  12. Origin of resistivity change in NiO thin films studied by hard x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Calka, P.; Martinez, E.; Lafond, D.; Minoret, S.; Tirano, S.; Detlefs, B.; Roy, J.; Zegenhagen, J.; Guedj, C.

    2011-06-01

    We investigated origins of the resistivity change during the forming of NiO based resistive random access memories in a nondestructive way using hard x-ray photoelectron spectroscopy. Energy shifts and bandgap states observed after switching suggest that oxygen vacancies are created in the low resistive state. As a result conduction may occur via defects such as electrons traps and metallic nickel impurities. Migration of oxygen atoms seems to be the driving mechanism. This provides concrete evidence of the major role played by oxygen defects in decreasing resistivity. This is a key point since oxygen vacancies are particularly unstable and thus difficult to identify by physico-chemical analyses.

  13. Application of maximum-entropy spectral estimation to deconvolution of XPS data. [X-ray Photoelectron Spectroscopy

    NASA Technical Reports Server (NTRS)

    Vasquez, R. P.; Klein, J. D.; Barton, J. J.; Grunthaner, F. J.

    1981-01-01

    A comparison is made between maximum-entropy spectral estimation and traditional methods of deconvolution used in electron spectroscopy. The maximum-entropy method is found to have higher resolution-enhancement capabilities and, if the broadening function is known, can be used with no adjustable parameters with a high degree of reliability. The method and its use in practice are briefly described, and a criterion is given for choosing the optimal order for the prediction filter based on the prediction-error power sequence. The method is demonstrated on a test case and applied to X-ray photoelectron spectra.

  14. Band alignment at the interface of PbTe/SnTe heterojunction determined by X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Shu, Tianyu; Ye, Zhenyu; Lu, Pengqi; Chen, Lu; Xu, Gangyi; Zhou, Jie; Wu, Huizhen

    2016-11-01

    We report the determination of band alignment of PbTe/SnTe (111) heterojunction interfaces using X-ray photoelectron spectroscopy (XPS). Multiple core levels of Pb and Sn were utilized to determine the valence band offset (VBO) of the heterojunction. The XPS result shows a type-III band alignment with the VBO of 1.37+/- 0.18 \\text{eV} and the conduction band offset (CBO) of 1.23+/- 0.18 \\text{eV} . The experimental determination of the band alignment of the PbTe/SnTe heterojunction shall benefit the improvement of PbTe/SnTe-related optoelectronic and electronic devices.

  15. Variable growth modes of CaF2 on Si(111) determined by x-ray photoelectron diffraction

    NASA Astrophysics Data System (ADS)

    Denlinger, J. D.; Rotenberg, Eli; Hessinger, Uwe; Leskovar, M.; Olmstead, Marjorie A.

    1993-04-01

    Chemical discrimination of bulk and interface Ca 2p x-ray photoelectron diffraction modulations is used to identify three growth regimes during the initial stages of CaF2 epitaxy on Si(111). Low flux, high temperature conditions produce island growth atop a nonwetting, chemically reacted Ca-F interface layer. Changing the growth kinetics by increasing the flux produces more laminar growth. Lowering the substrate temperature produces a more stoichiometric CaF2 interface layer that results in immediate wetting and laminar growth.

  16. X-ray absorption and photoelectron spectroscopy studies on graphite and single-walled carbon nanotubes: Oxygen effect

    NASA Astrophysics Data System (ADS)

    Abbas, M.; Wu, Z. Y.; Zhong, J.; Ibrahim, K.; Fiori, A.; Orlanducci, S.; Sessa, V.; Terranova, M. L.; Davoli, Ivan

    2005-08-01

    We have investigated the electronic states of highly oriented pyrolitic graphite and single-walled carbon nanotubes using x-ray absorption spectroscopy (XAS) before and after annealing treatment in ultrahigh vacuum, and observed that the small peak between π* and σ* features, which has been previously assigned to free-electron-like interlayer states, disappears after in situ annealing treatment, suggesting that the signal may be assigned to a surface contamination, especially oxygen contamination introduced by chemical processing or gas adsorption. Additional experiments by photoelectron spectroscopy as well as XAS methods, performed after aging in air, fully support this interpretation.

  17. Band alignment of InN/6H-SiC heterojunction determined by x-ray photoelectron spectroscopy

    SciTech Connect

    Jing, Qiang; Wu, Guoguang; Zhang, Yuantao; Gao, Fubin; Cai, Xupu; Zhao, Yang; Li, Wancheng Du, Guotong

    2014-08-11

    The valence band offset (VBO) of InN/6H-SiC heterojunction has been directly measured by x-ray photoelectron spectroscopy. The VBO is determined to be −0.10 ± 0.23 eV and the conduction band offset is deduced to be −2.47 ± 0.23 eV, indicating that the heterojunction has a type-II band alignment. The accurate determination of the valence and conduction band offsets is important for applications and analysis of InN/6H-SiC optoelectronic devices.

  18. Silicon nanocrystals with high boron and phosphorus concentration hydrophilic shell—Raman scattering and X-ray photoelectron spectroscopic studies

    SciTech Connect

    Fujii, Minoru Sugimoto, Hiroshi; Hasegawa, Masataka; Imakita, Kenji

    2014-02-28

    Boron (B) and phosphorus (P) codoped silicon (Si) nanocrystals, which exhibit very wide range tunable luminescence due to the donor to acceptor transitions and can be dispersed in polar liquids without organic ligands, are studied by Raman scattering and X-ray photoelectron spectroscopies. Codoped Si nanocrystals exhibit a Raman spectrum significantly different from those of intrinsic ones. First, the Raman peak energy is almost insensitive to the size and is very close to that of bulk Si crystal in the diameter range of 2.7 to 14 nm. Second, the peak is much broader than that of intrinsic ones. Furthermore, an additional broad peak, the intensity of which is about 20% of the main peak, appears around 650 cm{sup −1}. The peak can be assigned to local vibrational modes of substitutional B and B-P pairs, B clusters, B-interstitial clusters, etc. in Si crystal. The Raman and X-ray photoelectron spectroscopic studies suggest that a crystalline shell heavily doped with these species is formed at the surface of a codoped Si nanocrystal and it induces the specific properties, i.e., hydrophilicity, high-stability in water, high resistance to hydrofluoric acid, etc.

  19. X-ray photoelectron spectroscopy study of irradiation-induced amorphizaton of Gd2Ti2O7

    NASA Astrophysics Data System (ADS)

    Chen, J.; Lian, J.; Wang, L. M.; Ewing, R. C.; Boatner, L. A.

    2001-09-01

    The radiation-induced evolution of the microstructure of Gd2Ti2O7, an important pyrochlore phase in radioactive waste disposal ceramics and a potential solid electrolyte and oxygen gas sensor, has been characterized using transmission electron microscopy and x-ray photoelectron spectroscopy. Following the irradiation of a Gd2Ti2O7 single crystal with 1.5 MeV Xe+ ions at a fluence of 1.7×1014Xe+/cm2, cross-sectional transmission electron microscopy revealed a 300-nm-thick amorphous layer at the specimen surface. X-ray photoelectron spectroscopy analysis of the Ti 2p and O 1s electron binding energy shifts of Gd2Ti2O7 before and after amorphization showed that the main results of ion-irradiation-induced disorder are a decrease in the coordination number of titanium and a transformation of the Gd-O bond. These features resemble those occurring in titanate glass formation, and they have implications for the chemical stability and electronic properties of pyrochlores subjected to displacive radiation damage.

  20. X-Ray photoelectron diffraction and photoelectron holography as methods for investigating the local atomic structure of the surface of solids

    NASA Astrophysics Data System (ADS)

    Kuznetsov, M. V.; Ogorodnikov, I. I.; Vorokh, A. S.

    2014-01-01

    The state-of-the-art theory and experimental applications of X-ray photoelectron diffraction (XPD) and photoelectron holography (PH) are discussed. These methods are rapidly progressing and serve to examine the surface atomic structure of solids, including nanostructures formed on surfaces during adsorption of gases, epitaxial film growth, etc. The depth of analysis by these methods is several nanometres, which makes it possible to characterize the positions of atoms localized both on and beneath the surface. A remarkable feature of the XPD and PH methods is their sensitivity to the type of examined atoms and, in the case of high energy resolution, to the particular chemical form of the element under study. The data on experimental applications of XPD and PH to studies of various surface structures are analyzed and generalized. The bibliography includes 121 references.

  1. Interaction of human plasma fibrinogen with commercially pure titanium as studied with atomic force microscopy and X-ray photoelectron spectroscopy.

    PubMed

    Keere, Isabel Van De; Willaert, Ronnie; Hubin, Annick; Vereecken, Jean

    2008-03-04

    The surface of a biomaterial interacts with the body fluid upon implantation in the human body. The biocompatibility of a material is strongly influenced by the adsorption of proteins onto the surface. Titanium is frequently used as a biomaterial for implants in orthopedics and cardiovascular devices. Understanding the biocompatibility is very important to improve implants. The surface chemistry of an implant material and its influence on the interaction with body fluid is crucial in that perspective. The main goal of this study was to investigate the conformation of human plasma fibrinogen (HPF) adsorbed on commercially pure titanium (CP Ti) on a molecular level by means of ex situ atomic force microscopy (AFM). With X-ray photoelectron spectroscopy combined with argon ion beam depth profiling, it was shown that the oxide layer present at the surface was mainly composed of TiO2, with a small percentage of Ti2O3. Ex situ AFM imaging showed the conformation of HPF on CP Ti. Single molecules and aggregates of fibrinogen were observed. The trinodular structure of single HPF molecules (two spherical D domains at the distal ends of the extended molecule and the central spherical E domain) adsorbed onto CP Ti was visualized. Aggregate formation through the connection of the D domains of the HPF molecules was observed on CP Ti. The alphaC domains of HPF were not visible on CP Ti. The ex situ AFM images indicated conformational changes of HPF upon adsorption onto CP Ti. The conformation of the adsorbed HPF molecules was different on mica and titanium. The difference in wettability between both substrates caused a larger spread of the protein on the CP Ti surface and thus resulted in a larger perturbation to the native structure of HPF as compared to mica.

  2. Photoelectron interference fringes by super intense x-ray laser pulses

    NASA Astrophysics Data System (ADS)

    Toyota, Koudai; Tolstikhin, Oleg I.; Morishita, Toru; Watanabe, Shinichi

    2009-09-01

    The photoelectron spectra of H- produced by circularly polarized strong high-frequency laser pulses are theoretically studied. An oscillating substructure in the above-threshold ionization (ATI) peaks is observed, which extends the validity of the earlier findings in the 1D calculations [K. Toyota et al., Phys. Rev. A 76, 043418 (2007)] and 3D calculations for linear polarization [O. I. Tolstikhin, Phys. Rev. A 77, 032712 (2008)]. Its origin is due to an interference between a pair of photoelectron wave packets created in the rising and falling part of the pulse, which appears clearly in the stabilization regime.

  3. X-ray photoelectron spectroscopy analysis of cleaning procedures for synchrotron radiation beamline materials at the Advanced Photon Source

    SciTech Connect

    Li, Y.; Ryding, D.; Liu, C.; Kuzay, T.M.; McDowell, M.W.; Rosenberg, R.A.

    1994-12-31

    TZM (a high temperature molybdenum alloy), machinable tungsten, and 304 stainless steel were cleaned using environmentally safe, commercially available cleaning detergents. The surface cleanliness was evaluated by x-ray photoelectron spectroscopy (XPS). It was found that a simple alkaline detergent is very effective at removal of organic and inorganic surface contaminants or foreign particle residue from machining processes. The detergent can be used with ultrasonic agitation at 140 F to clean the TZM molybdenum, machinable tungsten, and 304 stainless steel. A citric-acid-based detergent was also found to be effective at cleaning metal oxides, such as iron oxide, molybdenum oxide, as well as tungsten oxides at mild temperatures with ultrasonic agitation, and it can be used to replace strong inorganic acids to improve cleaning safety and minimize waste disposal and other environmental problems. The efficiency of removing the metal oxides depends on both cleaning temperature and time.

  4. Thermal stability of electron-irradiated poly(tetrafluoroethylene) - X-ray photoelectron and mass spectroscopic study

    NASA Technical Reports Server (NTRS)

    Wheeler, Donald R.; Pepper, Stephen V.

    1990-01-01

    Polytetrafluoroethylene (PTFE) was subjected to 3 keV electron bombardment and then heated in vacuum to 300 C. The behavior of the material as a function of radiation dose and temperature was studied by X-ray photoelectron spectroscopy (XPS) of the surface and mass spectroscopy of the species evolved. Lightly damaged material heated to 300 C evolved saturated fluorocarbon species, whereas unsaturated fluorocarbon species were evolved from heavily damaged material. After heating the heavily damaged material, those features in the XPS spectrum that were associated with damage diminished, giving the appearance that the radiation damage had annealed. The observations were interpreted by incorporating mass transport of severed chain fragments and thermal decomposition of severely damaged material into the branched and cross-linked network model of irradiated PTFE. The apparent annealing of the radiation damage was due to covering of the network by saturated fragments that easily diffused through the decomposed material to the surface region upon heating.

  5. Understanding Chemical versus Electrostatic Shifts in X-ray Photoelectron Spectra of Organic Self-Assembled Monolayers

    PubMed Central

    2016-01-01

    The focus of the present article is on understanding the insight that X-ray photoelectron spectroscopy (XPS) measurements can provide when studying self-assembled monolayers. Comparing density functional theory calculations to experimental data on deliberately chosen model systems, we show that both the chemical environment and electrostatic effects arising from a superposition of molecular dipoles influence the measured core-level binding energies to a significant degree. The crucial role of the often overlooked electrostatic effects in polar self-assembled monolayers (SAMs) is unambiguously demonstrated by changing the dipole density through varying the SAM coverage. As a consequence of this effect, care has to be taken when extracting chemical information from the XP spectra of ordered organic adsorbate layers. Our results, furthermore, imply that XPS is a powerful tool for probing local variations in the electrostatic energy in nanoscopic systems, especially in SAMs. PMID:26937264

  6. Effects of proton irradiation on single-stranded DNA studied by using X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Lee, E.; Lee, Cheol Eui; Han, J. H.

    2016-08-01

    X-ray photoelectron spectroscopy (XPS) has been employed in order to study the effects of proton irradiation on herring sperm single-stranded DNA. Systematic changes of the chemical shifts in the C, N, O, and P XPS line components as functions of the irradiation dose were observed, indicative of the bonding configurations in the DNA system. While the C 1 s XPS lines showed weak blueshifts, the N 1 s, O 1 s, and P 2 p XPS lines showed blueshifts with a marked dependence on the irradiation dose in a prominent manner. Our results show that linear energy transfer by charged particles and photons may have distinct molecular-level effects as the C 1 s, N 1 s, O 1 s, and P 2 p XPS lines showed redshifts in our previous study of effects of the γ-ray irradiation on the same system.

  7. Investigation of passive films on {alpha}{sub 2} and {gamma} titanium aluminides by X-ray photoelectron spectroscopy

    SciTech Connect

    Ziomek-Moroz, M.; Su, W.; Covino, B.S. Jr.

    1999-07-01

    Passive films on {alpha}{sub 2} and {gamma} titanium aluminide formed potentiostatically in sodium hydroxide (NaOH) and sulfuric acid (H{sub 2}SO{sub 4}) solutions were studied by x-ray photoelectron spectroscopy (XPS). In NaOH, potentiostatic experiments showed that titanium aluminides had very similar passive current densities to that of Ti. XPS sputter depth profile showed nearly no Al present in the outer layer of the passive films. In H{sub 2}SO{sub 4}, passive current densities increased for specimens with increasing Al content. XPS sputter depth profile showed that Al was enriched in outer layers of the passive films. These results indicated that the passive film dissolution rates increased with increasing amounts of Al in the passive film for titanium aluminides.

  8. Investigation of passive films on alpha2 and gamma titanium aluminides by X-ray photoelectron spectroscopy

    SciTech Connect

    Ziomek-Moroz, M.; Su, W.; Covino, Bernard S., Jr.

    1999-07-01

    Passive films on alpha2 and gamma titanium aluminide formed potentiostatically in sodium hydroxide (NaOH) and sulfuric acid (H2SO4) solutions were studied by x-ray photoelectron microscopy (XPS). In NaOH, potentiostatic experiments showed that titanium aluminides had very similar passive current densities to that of Ti. XPS sputter depth profile showed nearly no Al present in the outer layer of the passive films. In H2SO4, passive current densities increased for specimens with increasing Al content. XPS sputter depth profile showed that Al was enriched in outer layers of the passive films. These results indicated that the passive film dissolution rate increased with increasing amounts of Al in the passive film for titanium aluminides.

  9. Surface Evaluation by X-Ray Photoelectron Spectroscopy of High Performance Polyimide Foams After Exposure to Oxygen Plasma

    NASA Technical Reports Server (NTRS)

    Melendez, Orlando; Hampton, Michael D.; Williams, Martha K.; Brown, Sylvia F.; Nelson, Gordon L.; Weiser, Erik S.

    2002-01-01

    Aromatic polyimides have been attractive in the aerospace and electronics industries for applications such as cryogenic insulation, flame retardant panels and structural subcomponents. Newer to the arena of polyimides is the synthesis of polyimide foams and their applications. In the present work, three different, closely related, polyimide foams developed by NASA Langley Research Center (LaRC) are studied by X-ray Photoelectron Spectroscopy (XPS) after exposure to radio frequency generated Oxygen Plasma. Although polyimide films exposure to atomic oxygen and plasma have been studied previously and reported, the data relate to films and not foams. Foams have much more surface area and thus present new information to be explored. Understanding degradation mechanisms and properties versus structure, foam versus solid is of interest and fundamental to the application and protection of foams exposed to atomic oxygen in Low Earth Orbit (LEO).

  10. Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.

    PubMed

    Dague, Etienne; Delcorte, Arnaud; Latgé, Jean-Paul; Dufrêne, Yves F

    2008-04-01

    Understanding the surface properties of microbial cells is a major challenge of current microbiological research and a key to efficiently exploit them in biotechnology. Here, we used three advanced surface analysis techniques with different sensitivity, probing depth, and lateral resolution, that is, in situ atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry, to gain insight into the surface properties of the conidia of the human fungal pathogen Aspergillus fumigatus. We show that the native ultrastructure, surface protein and polysaccharide concentrations, and amino acid composition of three mutants affected in hydrophobin production are markedly different from those of the wild-type, thereby providing novel insight into the cell wall architecture of A. fumigatus. The results demonstrate the power of using multiple complementary techniques for probing microbial cell surfaces.

  11. Energy-dispersive and x-ray photoelectron spectroscopy and electron microscopy of new quininium-plastic membrane electrodes.

    PubMed

    Shoukry, Adel F; Maraffie, Hayat M; Al-Shatti, Laila A

    2007-10-01

    New quininium (Qn) plastic membrane electrodes of the conventional type were constructed and characterized. They are based on incorporation of Qn-reineckate (QnRn) ion-pair, Qn-phosphotungstate (Qn3-PT), or Qn-phosphomolybdate (Qn3PM) ion associate into a poly(vinyl chloride) membrane. The electrodes are selective for Qn and have been successfully used for the determination of Qn2SO4 in pharmaceutical tablets. Nevertheless, they showed, as almost all other ion-selective electrodes, limited life times. Energy dispersive- (EDS) and X-ray photoelectron spectroscopy (XPS), as well as electron microscopy were applied to investigate the cause of this limitation in the life times of the electrodes. The results indicated that the electrodes lose their activity after prolonged soaking as a result of leaching of the ion exchanger from the membranes into the test solution in addition to deformation at the surface of the expired electrode.

  12. The X-ray photoelectron spectroscopy depth profiling and tribological characterization of ion-plated gold on various metals

    NASA Technical Reports Server (NTRS)

    Miyoshi, K.; Spalvins, T.; Buckley, D. H.

    1983-01-01

    For the case of ion-plated gold, the graded interface between gold and a nickel substrate and a nickel substrate, such tribological properties as friction and microhardness are examined by means of X-ray photoelectron spectroscopy analysis and depth profiling. Sliding was conducted against SiC pins in both the adhesive process, where friction arises from adhesion between sliding surfaces, and abrasion, in which friction is due to pin indentation and groove-plowing. Both types of friction are influenced by coating depth, but with opposite trends: the graded interface exhibited the highest adhesion, but the lowest abrasion. The coefficient of friction due to abrasion is inversely related to hardness. Graded interface microhardness values are found to be the highest, due to an alloying effect. There is almost no interface gradation between the vapor-deposited gold film and the substrate.

  13. Band alignment of TiO{sub 2}/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing

    SciTech Connect

    Fan, Haibo E-mail: liusz@snnu.edu.cn; Yang, Zhou; Ren, Xianpei; Gao, Fei; Yin, Mingli; Liu, Shengzhong E-mail: liusz@snnu.edu.cn

    2016-01-15

    The energy band alignment between pulsed-laser-deposited TiO{sub 2} and FTO was firstly characterized using high-resolution X-ray photoelectron spectroscopy. A valence band offset (VBO) of 0.61 eV and a conduction band offset (CBO) of 0.29 eV were obtained across the TiO{sub 2}/FTO heterointerface. With annealing process, the VBO and CBO across the heterointerface were found to be -0.16 eV and 1.06 eV, respectively, with the alignment transforming from type-I to type-II. The difference in the band alignment is believed to be dominated by the core level down-shift of the FTO substrate, which is a result of the oxidation of Sn. Current-voltage test has verified that the band alignment has a significant effect on the current transport of the heterojunction.

  14. Surface chemical composition of human maxillary first premolar as assessed by X-ray photoelectron spectroscopy (XPS)

    NASA Astrophysics Data System (ADS)

    Lou, Leo; Nelson, Alan E.; Heo, Giseon; Major, Paul W.

    2008-08-01

    The surface chemical composition of dental enamel has been postulated as a contributing factor in the variation of bond strength of brackets bonded to teeth, and hence, the probability of bracket failure during orthodontic treatment. This study systematically investigated the chemical composition of 98 bonding surfaces of human maxillary premolars using X-ray photoelectron spectroscopy (XPS) to ascertain compositional differences between right and left first premolars. The major elements detected in all samples were calcium, phosphorus, oxygen, nitrogen and carbon. Surface compositions were highly variable between samples and several elements were found to be highly correlated. No statistical significant difference in the chemical composition of the maxillary right and left first premolars was found ( p > 0.05). Knowledge of the chemical composition of enamel surfaces will facilitate future studies that relate this information to the variations in dental enamel bond strength.

  15. Surface characterization of immunosensor conjugated with gold nanoparticles based on cyclic voltammetry and X-ray photoelectron spectroscopy.

    PubMed

    Lai, Lee-Jene; Yang, Yaw-Wen; Lin, Yao-Kwang; Huang, Li-Ling; Hsieh, Yi-Heui

    2009-02-01

    This investigation describes the surface characterization of rabbit immunoglobulin G (IgG) conjugated with gold nanoparticles. Goat anti-rabbit immunoglobulin G tagged with 5nm gold nanoparticles was applied to detect the IgG. Then, the autocatalyzed deposition of Au(3+) onto the surface of anti-IgGAu increased the surface area per gold nanoparticle. The immobilization chemistries and the atomic concentrations of Au(4f), P(2p), S(2p), C(1s), N(1s) and O(1s) of the resulting antibody-modified Au electrodes were determined by X-ray photoelectron spectroscopy (XPS). The sulfur that is involved in the cysteamine binding and the enlargement of the gold nanoparticles are identified using cyclic voltammetry. The results reveal that the surface area per gold particle, following the autocatalyzed deposition Au(3+) on the surface of anti-IgGAu, was approximately seven times higher than that before deposition.

  16. Application of ESCA to the determination of stoichiometry in sputtered coatings and interface regions. [X-ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.

    1978-01-01

    X-ray Photoelectron Spectroscopy (XPS) was used to characterize radiofrequency sputter deposited films of several refractory compounds. Both the bulk film properties such as purity and stoichiometry and the character of the interfacial region between the film and substrate were examined. The materials were CrB2, MoS2, Mo2C, and Mo2B5 deposited on 440C steel. It was found that oxygen from the sputtering target was the primary impurity in all cases. Biasing improves the film purity. The effect of biasing on film stoichiometry is different for each compound. Comparison of the interfacial composition with friction data suggests that adhesion of these films is improved if a region of mixed film and iron oxides can be formed.

  17. Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy

    SciTech Connect

    Gabás, M.; Ramos Barrado, José R.; Torelli, P.; Barrett, N. T.

    2014-01-01

    Al- and Ga-doped sputtered ZnO films (AZO, GZO) are semiconducting and metallic, respectively, despite the same electronic valence structure of the dopants. Using hard X-ray photoelectron spectroscopy we observe that both dopants induce a band in the electronic structure near the Fermi level, accompanied by a narrowing of the Zn 3d/O 2p gap in the valence band and, in the case of GZO, a substantial shift in the Zn 3d. Ga occupies substitutional sites, whereas Al dopants are in both substitutional and interstitial sites. The latter could induce O and Zn defects, which act as acceptors explaining the semiconducting character of AZO and the lack of variation in the optical gap. By contrast, mainly substitutional doping is consistent with the metallic-like behavior of GZO.

  18. XPS studies of structure-induced radiation effects at the Si/SiO2 interface. [X ray Photoelectron Spectroscopy

    NASA Technical Reports Server (NTRS)

    Grunthaner, F. J.; Lewis, B. F.; Zamini, N.; Maserjian, J.; Madhukar, A.

    1980-01-01

    The interfacial structures of radiation hard and soft oxides grown by dry and wet processes on silicon substrates have been examined by high-resolution X-ray photoelectron spectroscopy. It is found that the primary difference in the local atomic structure at the Si/SiO2 interface is the significantly higher concentration of strained 120 deg SiO2 bonds and SiO interfacial species in soft samples. Results of in situ radiation damage experiments using low energy electrons (0-20 eV) are reported which correlate with the presence of a strained layer of SiO2 (20 A) at the interface. The results are interpreted in terms of a structural model for hole and electron trap generation by ionizing radiation.

  19. Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers

    PubMed Central

    2016-01-01

    Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM–ambient interface. Here we show that such systems can also be used for continuously tuning metal work functions by growing mixed monolayers consisting of molecules with different orientations of the embedded dipolar groups. To avoid injection hot-spots when using the SAM-modified electrodes in devices, a homogeneous mixing of the two components is crucial. We show that a combination of high-resolution X-ray photoelectron spectroscopy with state-of-the-art simulations is an ideal tool for probing the electrostatic homogeneity of the layers and thus for determining phase separation processes in polar adsorbate assemblies down to inhomogeneities at the molecular level. PMID:27429041

  20. Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers.

    PubMed

    Hehn, Iris; Schuster, Swen; Wächter, Tobias; Abu-Husein, Tarek; Terfort, Andreas; Zharnikov, Michael; Zojer, Egbert

    2016-08-04

    Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM-ambient interface. Here we show that such systems can also be used for continuously tuning metal work functions by growing mixed monolayers consisting of molecules with different orientations of the embedded dipolar groups. To avoid injection hot-spots when using the SAM-modified electrodes in devices, a homogeneous mixing of the two components is crucial. We show that a combination of high-resolution X-ray photoelectron spectroscopy with state-of-the-art simulations is an ideal tool for probing the electrostatic homogeneity of the layers and thus for determining phase separation processes in polar adsorbate assemblies down to inhomogeneities at the molecular level.

  1. Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Shibuta, Masahiro; Eguchi, Toyoaki; Watanabe, Yoshio; Son, Jin-Young; Oji, Hiroshi; Nakajima, Atsushi

    2012-11-01

    We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ˜10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

  2. Characterization of SiC fibers by soft x-ray photoelectron and photoabsorption spectroscopies and scanning Auger microscopy

    SciTech Connect

    Ma, Qing; McDowell, M.W.; Rosenberg, R.A.

    1996-08-01

    Synchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers produced by CVD on a W core and followed by a C passivating layer. Depth profiling of the fiber through the C/SiC interface was done by making Si 2p and C 1s core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar{sup +} sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed versus depth, indicating no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominantely graphite-like and those of the CVD SiC coatings are microcrystalline, with disorder present to some extent in both cases.

  3. X-ray photoelectron spectroscopy study on the chemistry involved in tin oxide film growth during chemical vapor deposition processes

    SciTech Connect

    Mannie, Gilbere J. A.; Gerritsen, Gijsbert; Abbenhuis, Hendrikus C. L.; Deelen, Joop van; Niemantsverdriet, J. W.; Thuene, Peter C.

    2013-01-15

    The chemistry of atmospheric pressure chemical vapor deposition (APCVD) processes is believed to be complex, and detailed reports on reaction mechanisms are scarce. Here, the authors investigated the reaction mechanism of monobutyl tinchloride (MBTC) and water during SnO{sub 2} thin film growth using x-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM). XPS results indicate an acid-base hydrolysis reaction mechanism, which is tested with multilayer experiments, demonstrating self-terminating growth. In-house developed TEM wafers are used to visualize nucleation during these multilayer experiments, and results are compared with TEM results of APCVD samples. Results show almost identical nucleation behavior implying that their growth mechanism is identical. Our experiments suggest that in APCVD, when using MBTC and water, SnO{sub 2} film growth occurs via a heterolytic bond splitting of the Sn-Cl bonds without the need to invoke gas-phase radical or coordination chemistry of the MBTC precursor.

  4. Interface investigations of a commercial lithium ion battery graphite anode material by sputter depth profile X-ray photoelectron spectroscopy.

    PubMed

    Niehoff, Philip; Passerini, Stefano; Winter, Martin

    2013-05-14

    Here we provide a detailed X-ray photoelectron spectroscopy (XPS) study of the electrode/electrolyte interface of a graphite anode from commercial NMC/graphite cells by intense sputter depth profiling using a polyatomic ion gun. The uniqueness of this method lies in the approach using 13-step sputter depth profiling (SDP) to obtain a detailed model of the film structure, which forms at the electrode/electrolyte interface often noted as the solid electrolyte interphase (SEI). In addition to the 13-step SDP, several reference experiments of the untreated anode before formation with and without electrolyte were carried out to support the interpretation. Within this work, it is shown that through charging effects during X-ray beam exposure chemical components cannot be determined by the binding energy (BE) values only, and in addition, that quantification by sputter rates is complicated for composite electrodes. A rough estimation of the SEI thickness was carried out by using the LiF and graphite signals as internal references.

  5. Adsorption, X-ray Diffraction, Photoelectron, and Atomic Emission Spectroscopy Benchmark Studies for the Eighth Industrial Fluid Properties Simulation Challenge.

    PubMed

    Ross, Richard B; Aeschliman, David B; Ahmad, Riaz; Brennan, John K; Brostrom, Myles L; Frankel, Kevin A; Moore, Jonathan D; Moore, Joshua D; Mountain, Raymond D; Poirier, Derrick M; Thommes, Matthias; Shen, Vincent K; Schultz, Nathan E; Siderius, Daniel W; Smith, Kenneth D

    2016-02-01

    The primary goal of the eighth industrial fluid properties simulation challenge was to test the ability of molecular simulation methods to predict the adsorption of organic adsorbates in activated carbon materials. The challenge focused on the adsorption of perfluorohexane in the activated carbon standard BAM-P109 (Panne and Thünemann 2010). Entrants were challenged to predict the adsorption of perfluorohexane in the activated carbon at a temperature of 273 K and at relative pressures of 0.1, 0.3, and 0.6. The relative pressure (P/Po) is defined as that relative to the bulk saturation pressure predicted by the fluid model at a given temperature (273 K in this case). The predictions were judged by comparison to a set of experimentally determined values, which are published here for the first time and were not disclosed to the entrants prior to the challenge. Benchmark experimental studies, described herein, were also carried out and provided to entrants in order to aid in the development of new force fields and simulation methods to be employed in the challenge. These studies included argon, carbon dioxide, and water adsorption in the BAM-P109 activated carbon as well as X-ray diffraction, X-ray microtomography, photoelectron spectroscopy, and atomic emission spectroscopy studies of BAM-P109. Several concurrent studies were carried out for the BAM-P108 activated carbon (Panne and Thünemann 2010). These are included in the current manuscript for comparison.

  6. Adsorption, X-ray Diffraction, Photoelectron, and Atomic Emission Spectroscopy Benchmark Studies for the Eighth Industrial Fluid Properties Simulation Challenge*+

    PubMed Central

    Ross, Richard B.; Aeschliman, David B.; Ahmad, Riaz; Brennan, John K.; Brostrom, Myles L.; Frankel, Kevin A.; Moore, Jonathan D.; Moore, Joshua D.; Mountain, Raymond D.; Poirier, Derrick M.; Thommes, Matthias; Shen, Vincent K.; Schultz, Nathan E.; Siderius, Daniel W.; Smith, Kenneth D.

    2016-01-01

    The primary goal of the eighth industrial fluid properties simulation challenge was to test the ability of molecular simulation methods to predict the adsorption of organic adsorbates in activated carbon materials. The challenge focused on the adsorption of perfluorohexane in the activated carbon standard BAM-P109 (Panne and Thünemann 2010). Entrants were challenged to predict the adsorption of perfluorohexane in the activated carbon at a temperature of 273 K and at relative pressures of 0.1, 0.3, and 0.6. The relative pressure (P/Po) is defined as that relative to the bulk saturation pressure predicted by the fluid model at a given temperature (273 K in this case). The predictions were judged by comparison to a set of experimentally determined values, which are published here for the first time and were not disclosed to the entrants prior to the challenge. Benchmark experimental studies, described herein, were also carried out and provided to entrants in order to aid in the development of new force fields and simulation methods to be employed in the challenge. These studies included argon, carbon dioxide, and water adsorption in the BAM-P109 activated carbon as well as X-ray diffraction, X-ray microtomography, photoelectron spectroscopy, and atomic emission spectroscopy studies of BAM-P109. Several concurrent studies were carried out for the BAM-P108 activated carbon (Panne and Thünemann 2010). These are included in the current manuscript for comparison. PMID:27840543

  7. Reduction of Vanadium Oxide (VOx) under High Vacuum Conditions as Investigated by X-Ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Chourasia, A.

    2015-03-01

    Vanadium oxide thin films were formed by depositing thin films of vanadium on quartz substrates and oxidizing them in an atmosphere of oxygen. The deposition was done by the e-beam technique. The oxide films were annealed at different temperatures for different times under high vacuum conditions. The technique of x-ray photoelectron spectroscopy has been employed to study the changes in the oxidation states of vanadium and oxygen in such films. The spectral features in the vanadium 2p, oxygen 1s, and the x-ray excited Auger regions were investigated. The Auger parameter has been utilized to study the changes. The complete oxidation of elemental vanadium to V2O5 was observed to occur at 700°C. At any other temperature, a mixture of oxides consisting of V2O5 and VO2 was observed in the films. Annealing of the films resulted in the gradual loss of oxygen followed by reduction in the oxidation state from +5 to 0. The reduction was observed to depend upon the annealing temperature and the annealing time. Organized Research, TAMU-Commerce.

  8. Charge transfer in nanocrystalline-Au /ZnO nanorods investigated by x-ray spectroscopy and scanning photoelectron microscopy

    NASA Astrophysics Data System (ADS)

    Chiou, J. W.; Ray, S. C.; Tsai, H. M.; Pao, C. W.; Chien, F. Z.; Pong, W. F.; Tsai, M.-H.; Wu, J. J.; Tseng, C. H.; Chen, C.-H.; Lee, J. F.; Guo, J.-H.

    2007-05-01

    O K- and Zn and Au L3-edge x-ray absorption near-edge structure (XANES), x-ray emission spectroscopy (XES), and scanning photoelectron microscopy (SPEM) are performed to investigate the electronic structure of ZnO nanorods with nanocrystalline (nc)-Au particles grown on the surfaces. The XANES spectra of nc-Au /ZnO nanorods reveal the decrease of the number of both O 2p and Zn 4s/3d unoccupied states with the increase of the nc-Au particle size. The number of Au 6s /5d unoccupied states increases when the size of nc-Au particle decreases, indicating that the deposition of nc-Au particles on the surface of ZnO nanorods promotes charge transfer from the ZnO nanorods to nc-Au particles. Excitation energy dependent XES and SPEM spectra show that the number of electrons in the valence band of O 2p-Zn 4sp hybridized states decreases as the nc-Au particle size increases, revealing that more electrons are excited from the valence band to the conduction band of ZnO nanorods and the storage of electrons in nc-Au particles.

  9. Picosecond x-ray laser photoelectron spectroscopy of room temperature and heated materials

    SciTech Connect

    Dunn, J; Nelson, A J; van Buuren, T; Hunter, J R

    2004-08-03

    An 84.5 eV Ni-like Pd ion 4d - 4p x-ray laser source generated by the LLNL Compact Multipulse Terawatt (COMET) tabletop system has been used to probe the electronic structure of various metals and semiconductors. In addition to the {approx}4 - 5 ps time resolution, the probe provides the necessary high photon flux (>10{sup 12}/pulse), narrow line width ({Delta}E/E{approx}2 x 10{sup -5}) and coherence for studying valence band and shallow core electronic structure levels in a single shot. We show some preliminary results of room temperature and heated thin foil samples consisting of 50 nm Cu coated on a 20 nm C substrate. A 527 nm wavelength 400 fs laser pulse containing 0.1 - 2.5 mJ laser energy is focused in a large 500 x 700 {micro}m{sup 2} (FWHM) spot to create heated conditions of 0.07 - 1.8 x 1012 W cm{sup -2} intensity.

  10. X-ray photoelectron spectra and electronic structure of rare-earth orthovanadates

    NASA Astrophysics Data System (ADS)

    Ryzhkov, M. V.; Kostikov, S. P.; Ivanov, I. K.; Gubanov, V. A.

    1981-08-01

    Photoelectron spectra of 4 d and valence states in RVO 4 ( R = Y, Nd, Eu, Gd, Tb, Dy, Yb) have been investigated. The experimental spectra are interpreted using the results of the Xα discrete variational method calculations for orthovanadates. Transformations of electronic structure and covalency in the RVO 4 series are discussed. It is shown that lanthanide 4 f orbitals significantly mix with the O 2 pAO's and hybridize with the rare-earths 5 pAO's. The 5 p levels spin-orbital splitting in orthovanadates has been evaluated.

  11. Electronic structure transformation in small bare Au clusters as seen by x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Andersson, T.; Zhang, C.; Björneholm, O.; Mikkelä, M.-H.; Jänkälä, K.; Anin, D.; Urpelainen, S.; Huttula, M.; Tchaplyguine, M.

    2017-01-01

    Free bare gold clusters in the size range from few tens to few hundred atoms (≤1 nm dimensions) have been produced in a beam, and the size-dependent development of their full valence band including the 5d and 6s parts has been mapped ‘on the fly’ by synchrotron-based photoelectron spectroscopy. The Au 4f core level has been also probed, and the cluster-specific Au 4f ionization energies have been used to estimate the cluster size. The recorded in the present work valence spectra of the small clusters are compared with the spectra of the large clusters ( N ∼ 103) created by us using a magnetron-based gas aggregation source. The comparison shows a substantially narrower 5d valence band and the decrease in its splitting for gold clusters in the size range of few hundred atoms and below. Our DFT calculations involving the pseudopotential method show that the 5d band width of the ground state increases with the cluster size and by the size N = 20 becomes comparable with the experimental width of the valence photoelectron spectrum. Similar to the earlier observations on supported clusters we interpret our experimental and theoretical results as due to the undercoordination of a large fraction of atoms in the clusters with N ∼ 102 and below. The consequences of such electronic structure of small gold clusters are discussed in connection with their specific physical and chemical properties related to nanoplasmonics and nanocatalysis.

  12. Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Lee, Kyeongmi; Nomura, Kenji; Yanagi, Hiroshi; Kamiya, Toshio; Ikenaga, Eiji; Sugiyama, Takeharu; Kobayashi, Keisuke; Hosono, Hideo

    2012-08-01

    Although amorphous InGaZnO4 has intensively been studied for a semiconductor channel material of thin-film transistors in next-generation flat-panel displays, its electronic structure parameters have not been reported. In this work, the electron affinities (χ) and the ionization potentials (Ip) of crystalline and amorphous InGaZnO4 (c-IGZO and a-IGZO) were measured using bulk-sensitive hard x-ray photoelectron spectroscopy. First, the χ and Ip values of c-IGZO and a-IGZO thin films were estimated by aligning the Zn 2p3/2 core level energies to a literature value for ZnO, which provided χ = 3.90 eV and Ip = 7.58 eV for c-IGZO and 4.31 eV and 7.41 eV for a-IGZO. It was also confirmed that the escape depth of the photoelectrons excited by the photon energy of 5950.2 eV is 3.3 nm for a-IGZO and large enough for directly measuring the interface electronic structure using a-IGZO/c-Si heterojunctions. It provided the valence band offset of ˜2.3 eV, which agrees well with the above data. The present results substantiate that the a-IGZO/c-Si interface follows well the Schottky-Mott rule.

  13. Final-state effect on X-ray photoelectron spectrum of n-doped SrTiO3

    NASA Astrophysics Data System (ADS)

    Lin, Chungwei; Posadas, Agham; Demkov, Alexander; Demkov Team

    2015-03-01

    X-ray photoelectron spectroscopy (XPS) is a widely used technique to determine the oxidation states of chemical elements. In stoichiometric SrTiO3, the Ti4+ peak appears at a binding energy of about 459.0 eV for photoelectrons ejected from the Ti 2 p core level. In lightly n-doped SrTiO3, a weak shoulder at a binding energy of about 1.5 eV lower than the Ti4+ peak appears in the XPS spectrum that has been conventionally interpreted as a Ti3+ signal. By taking the final-state effect into account, i.e. by considering the response of the valence electrons in the presence of a core hole, we argue that such a Ti3+ peak does not necessarily imply the existence of spatially localized Ti3+ ions, and explicitly show that a spatially uniform Ti(4 - x) + distribution also leads to the multi-peak structure. Spectra from metallic n-doped SrTiO3 (e.g. La replacing Sr, Nb replacing Ti, or even oxygen vacancy doping) should be interpreted as the latter case. Several experiments based on this interpretation are discussed. Support for this work was provided through Scientific Discovery through Advanced Computing (SciDAC) program funded by U.S. DOE, Office of Science, Advanced Scientific Computing Research and Basic Energy Sciences under award number DESC0008877.

  14. Dissociation of strong acid revisited: X-ray photoelectron spectroscopy and molecular dynamics simulations of HNO3 in water

    SciTech Connect

    Lewis, Tanza; Winter, Berndt; Stern, Abraham C.; Baer, Marcel D.; Mundy, Christopher J.; Tobias, Douglas J.; Hemminger, J. C.

    2011-08-04

    Molecular-level insight into the dissociation of nitric acid in water is obtained from photoelectron X-ray spectroscopy and first-principles molecular dynamics (MD) simulations. Our combined studies reveal surprisingly abrupt changes in solvation configurations of undissociated nitric acid at approximately 4 M concentration. Experimentally, this is inferred from N1s binding energy shifts of HNO3(aq) as a function of concentration, and is associated with variations in the local electronic structure of the nitrogen atom. It also shows up as a discontinuity in the degree of dissociation as a function of concentration, determined here from the N1s photoelectron signal intensity, which can be separately quantified for undissociated HNO3(aq) and dissociated NO3-(aq). Intermolecular interactions within the nitric acid solution are discussed on the basis of MD simulations, which reveal that molecular HNO3 interacts remarkably weakly with solvating water molecules at low concentration; around 4 M there is a turnover to a more structured solvation shell, accompanied by an increase in hydrogen bonding between HNO3 and water. We suggest that the driving force behind the more structured solvent configuration of HNO3 is the overlap of nitric acid solvent shells that sets in around 4 M concentration. This work was supported by the US Department of Energy Basic Energy Sciences' Chemical Sciences, Geosciences & Biosciences Division. Pacific Northwest National Laboratory is operated by Battelle for the US Department of Energy.

  15. Dissociation of strong acid revisited: X-ray photoelectron spectroscopy and molecular dynamics simulations of HNO3 in water.

    PubMed

    Lewis, Tanza; Winter, Bernd; Stern, Abraham C; Baer, Marcel D; Mundy, Christopher J; Tobias, Douglas J; Hemminger, John C

    2011-08-04

    Molecular-level insight into the dissociation of nitric acid in water is obtained from X-ray photoelectron spectroscopy and first-principles molecular dynamics (MD) simulations. Our combined studies reveal surprisingly abrupt changes in solvation configurations of undissociated nitric acid at approximately 4 M concentration. Experimentally, this is inferred from shifts of the N1s binding energy of HNO(3)(aq) as a function of concentration and is associated with variations in the local electronic structure of the nitrogen atom. It also shows up as a discontinuity in the degree of dissociation as a function of concentration, determined here from the N1s photoelectron signal intensity, which can be separately quantified for undissociated HNO(3)(aq) and dissociated NO(3)(-)(aq). Intermolecular interactions within the nitric acid solution are discussed on the basis of MD simulations, which reveal that molecular HNO(3) interacts remarkably weakly with solvating water molecules at low concentration; around 4 M there is a turnover to a more structured solvation shell, accompanied by an increase in hydrogen bonding between HNO(3) and water. We suggest that the driving force behind the more structured solvent configuration of HNO(3) is the overlap of nitric acid solvent shells that sets in around 4 M concentration.

  16. Surface study of stainless steel electrode deposition from soil electrokinetic (EK) treatment using X-ray photoelectron spectroscopy (XPS)

    SciTech Connect

    Embong, Zaidi; Johar, Saffuwan; Tajudin, Saiful Azhar Ahmad; Sahdan, Mohd Zainizan

    2015-04-29

    Electrokinetic (EK) remediation relies upon application of a low-intensity direct current through the soil between stainless steel electrodes that are divided into a cathode array and an anode array. This mobilizes charged species, causing ions and water to move toward the electrodes. Metal ions and positively charged organic compounds move toward the cathode. Anions such as chloride, fluoride, nitrate, and negatively charged organic compounds move toward the anode. Here, this remediation techniques lead to a formation of a deposition at the both cathode and anode surface that mainly contributed byanion and cation from the remediated soil. In this research, Renggam-Jerangau soil species (HaplicAcrisol + RhodicFerralsol) with a surveymeter reading of 38.0 ± 3.9 μR/hr has been investigation in order to study the mobility of the anion and cation under the influence electric field. Prior to the EK treatment, the elemental composition of the soil and the stainless steel electrode are measured using XRF analyses. Next, the soil sample is remediated at a constant electric potential of 30 V within an hour of treatment period. A surface study for the deposition layer of the cathode and anode using X-ray Photoelectron spectroscopy (XPS) revealed that a narrow photoelectron signal from oxygen O 1s, carbon, C 1s silica, Si 2p, aluminium, Al 2p and chromium, Cr 2p exhibited on the electrode surface and indicate that a different in photoelectron intensity for each element on both electrode surface. In this paper, the mechanism of Si{sup 2+} and Al{sup 2+} cation mobility under the influence of voltage potential between the cathode and anode will be discussed in detail.

  17. X-ray photoelectron spectroscopic studies of graphitic materials and interfacial interactions in carbon-fiber-reinforced polymer composites

    NASA Astrophysics Data System (ADS)

    Viswanathan, Hema L.

    This dissertation involves the X-ray photoelectron spectroscopic (XPS) study of the chemistry associated with carbon fiber-reinforced composites fabricated using PAN-based carbon fibers and a thermoplastic polyimide resin. The mechanical properties of the ultimate composite are significantly affected by the nature of the fiber/matrix interface. Interfacial interaction can be promoted by the electrochemical modification of the fiber surface. The determination of carbon fiber microstructure was conducted through angle-resolved valence band photoemission studies of highly ordered graphite. The change in orientation of the basal planes and reactive edge sites with take-off angle provided a method for the determination of surface microstructure. The electronic structure of solid-state graphite was described using a band structure model and the results obtained were compared with the multiple scattered wave X a calculations. PAN-based fibers were electrochemically oxidized and studied using monochromatic X-radiation. The extremely narrow natural linewidth of the monochromatized Al K a radiation allowed previously unresolved features to be seen. In addition, sample decomposition due to radiative heat from the X-ray source is eliminated. Fibers that were pretreated by the manufacturer were subjected to further electrochemical oxidation. The fibers behaved in an erratic and non-reproducible manner. The surface treatment was removed by heating the fibers in vacuum, followed by XPS analysis and electrochemical oxidation. The fiber/matrix interface was simulated by coating a very thin layer of the polyimide resin on the surface of the fiber followed by XPS analysis. The validity of a proposed structure for the resin was confirmed by comparison with ab initio calculations conducted on the resin repeat unit. A high level of fiber/matrix interaction was observed for electrochemically oxidized fibers. The possibility of solvent interaction with the fiber surface was eliminated by

  18. Band offset in zinc oxy-sulfide/cubic-tin sulfide interface from X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    K. C., Sanal; Nair, P. K.; Nair, M. T. S.

    2017-02-01

    Zinc oxy-sulfide, ZnOxS1-x, has been found to provide better band alignment in thin film solar cells of tin sulfide of orthorhombic crystalline structure. Here we examine ZnOxS1-x/SnS-CUB interface, in which the ZnOxS1-x thin film was deposited by radio frequency (rf) magnetron sputtering on SnS thin film of cubic (CUB) crystalline structure with a band gap (Eg) of 1.72 eV, obtained via chemical deposition. X-ray photoelectron spectroscopy provides the valence band maxima of the materials and hence places the conduction band offset of 0.41 eV for SnS-CUB/ZnO0.27S0.73 and -0.28 eV for SnS-CUB/ZnO0.88S0.12 interfaces. Thin films of ZnOxS1-x with 175-240 nm in thickness were deposited from targets prepared with different ZnO to ZnS molar ratios. With the target of molar ratio of 1:13.4, the thin films are of composition ZnO0.27S0.73 with hexagonal crystalline structure and with that of 1:1.7 ratio, it is ZnO0.88S0.12. The optical band gap of the ZnOxS1-x thin films varies from 2.90 eV to 3.21 eV as the sulfur to zinc ratio in the film increases from 0.12:1 to 0.73:1 as determined from X-ray diffraction patterns. Thus, band offsets sought for absorber materials and zinc oxy-sulfide in solar cells may be achieved through a choice of ZnO:ZnS ratio in the sputtering target.

  19. X-ray Photoelectron Spectroscopy Study of Indium Tin Oxide Films Deposited at Various Oxygen Partial Pressures

    NASA Astrophysics Data System (ADS)

    Peng, Shou; Cao, Xin; Pan, Jingong; Wang, Xinwei; Tan, Xuehai; Delahoy, Alan E.; Chin, Ken K.

    2017-02-01

    Here, a systematic experimental study on indium tin oxide (ITO) films is presented to investigate the effects of oxygen partial pressure on the film's electrical properties. The results of Hall measurements show that adding more oxygen in the sputtering gas has negative influences on the electrical conductivity of ITO films. As O2/(O2 + Ar)% in the sputtering gas is increased from 0 to 6.98%, the resistivity of ITO film rises almost exponentially from 7.9 × 10-4 to 4.1 × 10-2 Ω cm, with the carrier density decreasing from 4.8 × 1020 to 5.4 × 1018 cm-3. The origins of these negative effects are discussed with focuses on the concentration of ionized impurities and the scattering of grain barriers. Extensive x-ray photoelectron spectroscopy (XPS) analyses were employed to gain insight into the concentration of ionized impurities, demonstrating a strong correlation between the oxygen vacancy concentration and the carrier density in ITO films as a function of sputtering O2 partial pressure. Other microstructural characterization techniques including x-ray diffraction (XRD), high-magnification scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM) analyses were used to evaluate the average grain size of ITO films. For ITO films that have carrier density above 1019 cm-3, scattering on grain boundaries and other crystallographic defects show negligible effects on the carrier transport. The results point to the oxygen vacancy concentration that dictates the carrier density and, thus, the resistivity of magnetron-sputtered ITO films.

  20. Size-induced changes in optical and X-ray photoelectron spectra of GaN nanoparticles deposited at lower substrate temperature.

    PubMed

    Mann, A K; Varandani, D; Mehta, B R; Malhotra, L K; Shivaprasad, S M

    2005-11-01

    This study reports the synthesis of GaN nanoparticles having hexagonal structure by a simple technique of activated reactive evaporation with substrates kept at comparatively lower temperatures than usually reported. By varying the substrate temperature from 30 degrees C to 350 degrees C, it is possible to vary nanoparticle sizes from 5-30 nm. X-ray diffraction and X-ray photoelectron spectroscopy analysis confirm the formation of GaN on quartz and silicon substrates at room temperature. The observed size dependent shift in energy position, large increase in full width at half maximum value of Ga 3d and N 1s X-ray photoelectron spectroscopy peaks and blue shift in the optical absorption edge are related to nanoparticle character.

  1. X-ray photoelectron spectroscopy study of SnO2 and SnO2+x thin films.

    PubMed

    Jeong, Jin; Lee, Bong Ju

    2013-01-01

    SnO2 thin films were fabricated using low-pressure thermal chemical vapor deposition. The results of X-ray photoelectron spectroscopy revealed that the SiO2 layer with an O1S-binding energy of 531.2 eV was formed before the SnO2 layer with an O1S-binding energy of 530.5 eV was formed. In the beginning, the SnO2 thin film showed Sn3d5-binding energy peaks of 485 eV and 486.5 eV. Subsequently, it grew in the direction of 486.5 eV. The Sn3d5-binding strength of the SnO2+x thin film that was annealed in oxygen atmosphere was weaker than that of the SnO2 thin film. Additionally, the Sn3d5-binding strength decreased linearly as the depth of the thin film increased. The surface O1S-binding strength of the SnO2+x thin film annealed in oxygen atmosphere was stronger than that of the SnO2 thin film; however, this strength became weaker than that that of the SnO2 thin film when the depth of the thin film was 2500A or higher.

  2. Characterization of photocatalytic TiO2 powder under varied environments using near ambient pressure X-ray photoelectron spectroscopy

    PubMed Central

    Krishnan, Padmaja; Liu, Minghui; Itty, Pierre A.; Liu, Zhi; Rheinheimer, Vanessa; Zhang, Min-Hong; Monteiro, Paulo J. M.; Yu, Liya E.

    2017-01-01

    Consecutive eight study phases under the successive presence and absence of UV irradiation, water vapor, and oxygen were conducted to characterize surface changes in the photocatalytic TiO2 powder using near-ambient-pressure X-ray photoelectron spectroscopy (XPS). Both Ti 2p and O 1s spectra show hysteresis through the experimental course. Under all the study environments, the bridging hydroxyl (OHbr) and terminal hydroxyl (OHt) are identified at 1.1–1.3 eV and 2.1–2.3 eV above lattice oxygen, respectively. This enables novel and complementary approach to characterize reactivity of TiO2 powder. The dynamic behavior of surface-bound water molecules under each study environment is identified, while maintaining a constant distance of 1.3 eV from the position of water vapor. In the dark, the continual supply of both water vapor and oxygen is the key factor retaining the activated state of the TiO2 powder for a time period. Two new surface peaks at 1.7–1.8 and 4.0–4.2 eV above lattice oxygen are designated as peroxides (OOH/H2O2) and H2O2 dissolved in water, respectively. The persistent peroxides on the powder further explain previously observed prolonged oxidation capability of TiO2 powder without light irradiation. PMID:28240300

  3. X-ray photoelectron spectroscopic depth profilometry of nitrogen implanted in materials for modification of their surface properties

    SciTech Connect

    Sarkissian, A.H.; Paynter, R.; Stansfield, B.L.; Leblanc, J.B.; Paradis, E.

    1996-12-31

    The modification of the surface properties of materials has a wide range of industrial applications. For example, the authors change the electrical characteristics of semiconductors, improve surface hardness, decrease friction, increase resistance to corrosion, improve adhesion, etc. Nitriding is one of the most common processes used in industry for surface treatment. Nitrogen ion implantation is one technique often used to achieve this goal. Ion implantation offers the power to control the deposition profile, and can be achieved by either conventional ion beam implantation or plasma assisted ion implantation. They have used the technique of plasma assisted ion implantation to implant nitrogen in several materials, including titanium, silicon and stainless steel. The plasma source is a surface ECR source developed at INRS-Energie et Materiaux. The depth profile of the implanted ions has been measured by X-ray photoelectron spectroscopy. They have also conducted simulations using the TRIM-95 code to predict the depth profile of the implanted ions. Comparisons of the measured results with those from simulations are used to deduce information regarding the plasma composition and the collisional effects in the plasma. A fast responding, current and voltage measuring circuit with fiber optic links is being developed, which allows more accurate quantitative measurements. Further experiments to study the characteristics of the plasma, and their effects on the characteristics of the implanted surfaces are in progress, and the results are presented at this meeting.

  4. Analysis of the surface of tricalcium silicate during the induction period by X-ray photoelectron spectroscopy

    SciTech Connect

    Bellmann, F.; Sowoidnich, T.; Ludwig, H.-M.; Damidot, D.

    2012-09-15

    X-ray photoelectron spectroscopy allows the analysis of surface layers with a thickness of a few nanometers. The method is sensitive to the chemical environment of the atoms since the binding energy of the electrons depends on the chemical bonds to neighboring atoms. It has been applied to the hydration of tricalcium silicate (Ca{sub 3}SiO{sub 5}, C{sub 3}S) by analyzing a sample after 30 min of hydration. Also two references have been investigated namely anhydrous C{sub 3}S and intermediate phase in order to enable a quantitative evaluation of the experimental data. In the hydrated C{sub 3}S sample, the analyzed volume (0.2 mm{sup 2} surface by 13 nm depth) contained approximately 44 wt.% of C{sub 3}S and 56 wt.% of intermediate phase whereas C-S-H was not detected. Scanning Electron Microscopy data and geometric considerations indicate that the intermediate phase forms a thin layer having a thickness of approximately 2 nm and covers the complete surface instead of forming isolated clusters.

  5. X-ray photoelectron spectroscopy analysis of boron defects in silicon crystal: A first-principles study

    NASA Astrophysics Data System (ADS)

    Yamauchi, Jun; Yoshimoto, Yoshihide; Suwa, Yuji

    2016-05-01

    We carried out a comprehensive study on the B 1s core-level X-ray photoelectron spectroscopy (XPS) binding energies and formation energies for boron defects in crystalline silicon by first-principles calculation with careful evaluation of the local potential boundary condition for the model system using the supercell corresponding to 1000 Si atoms. It is reconfirmed that the cubo-octahedral B12 cluster in silicon crystal is unstable and exists at the saddle point decaying to the icosahedral and S4 B12 clusters. The electrically active clusters without any postannealing of ion-implanted Si are identified as icosahedral B12 clusters. The experimentally proposed threefold coordinated B is also identified as a ⟨ 001 ⟩ B - Si defect. For an as-doped sample prepared by plasma doping, the calculated XPS spectra for complexes consisting of vacancies and substitutional B atoms are consistent with the experimental spectra. It is proposed that, assuming that the XPS peak at 187.1 eV is due to substitutional B (Bs), the experimental XPS peaks at 187.9 and 186.7 eV correspond to interstitial B at the H-site and ⟨ 001 ⟩ B - Si defects, respectively. In the annealed samples, the complex of Bs and interstitial Si near the T-site is proposed as a candidate for the experimental XPS peak at 188.3 eV.

  6. General equation for size nanocharacterization of the core-shell nanoparticles by X-ray photoelectron spectroscopy.

    PubMed

    Gillet, Jean-Numa; Meunier, Michel

    2005-05-12

    Nanocharacterization is essential for nanoengineering of new types of core-shell (c-s) nanoparticles, which can be used to design new devices for photonics, electronics, catalysis, medicine, etc. X-ray photoelectron spectroscopy (XPS) has been widely used to study the elemental composition of the c-s nanoparticles. However, the physical and chemical properties of a c-s nanoparticle dramatically depend on the sizes of its core and shell. We therefore propose a general equation for the XPS intensity of a c-s nanoparticle, which is based on an analytical model. With this equation, XPS can now also be used for nanocharacterization of the core and shell sizes of the c-s nanoparticles (with a diameter smaller than or equal to the XPS probing depth of approximately 10 nm). To validate the new equation with experimental XPS data, we first determine the average shell thickness of a group of c-s nanoparticles by comparing the XPS intensity of reference bare cores to that of the c-s nanoparticles. Then we study the growth kinetics of the cores and shells of another group of c-s nanoparticles where the shells are obtained by oxidation.

  7. Investigation of the glidant properties of compacted colloidal silicon dioxide by angle of repose and X-ray photoelectron spectroscopy.

    PubMed

    Jonat, Stéphane; Albers, Peter; Gray, Ann; Schmidt, Peter C

    2006-07-01

    The optimal flow-enhancing effect of a new compacted, hydrophilic colloidal silicon dioxide (AEROSIL 200 VV Pharma) on microcrystalline cellulose (Avicel PH 101) and pregelatinized starch (Starch 1500) was found to be 0.25% under gentle and 0.125% under strong mixing conditions, as measured by the angle of repose. The effect could be explained by X-ray photoelectron spectroscopy (XPS) investigations. The Si 2p signals of the silicon dioxide indicated that the coverage of the excipient surface with AEROSIL was greater for all mixtures produced under strong mixing conditions and corresponded to a higher degree of de-agglomeration of the AEROSIL aggregates. The more extensive surface coverage of Avicel PH 101 as compared to Starch 1500 could be explained by the particle morphology on the one hand and by the XPS C 1s signals on the other. Due to the different conformation of the two excipients, Avicel PH 101 offers a higher density of hydroxyl groups on its surface which are available for hydrogen bonding with the surface hydroxyl groups of hydrophilic colloidal silicon dioxide.

  8. Real-time studies of the atomic layer deposition of metal oxides using Ambient pressure x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Schnadt, Joachim; Head, Ashley R.; Chaudhary, Shilpi; Yngman, Sofie; Johansson, Niclas; Snezhkova, Olesia; Knudsen, Jan; Andersen, Jesper N.; Bluhm, Hendrik; Mikkelsen, Anders; Timm, Rainer

    2014-03-01

    Performing atomic layer deposition (ALD) of metal oxides at pressures around 0.01 mbar slows the half reactions of the process to allow in situ real-time probing of changes in the surface electronic structure using Ambient pressure x-ray photoelectron spectroscopy (APXPS). By monitoring the ALD process as it occurs, new details on the mechanisms of interface formation and thin film growth can be obtained. The deposition of HfO2 on InAs and the deposition of TiO2 on rutile titania from transition metal complexes and water were studied with APXPS. Predictable, cyclic chemical shifts of ligand and substrate ionizations are seen in the growth of the films, but the kinetics of the film growth differs for the two systems. Upon exposure to the titania surface, the titanium precursor reacts straightaway and gradually proceeds to completion. In contrast, the hafnium precursor does not interact with the surface immediately. Once an activation barrier is surpassed, the reaction occurs instantaneously. By understanding the reactivity of different precursors, the ALD process can be more easily optimized in applications that require thin films of metal oxides such as metal-oxide-semiconductor devices and catalytic surfaces. Support by the Swedish Research Council (grant no. 2010-5080) is gratefully acknowledged.

  9. Correlations for predicting the surface wettability for organic light-emitting-diode patterns by x-ray photoelectron spectroscopy analysis

    NASA Astrophysics Data System (ADS)

    Yang, L.; Svarnas, P.; Shard, A. G.; Bradley, J. W.; Seah, M. P.

    2010-12-01

    X-ray photoelectron spectroscopy (XPS) and contact angle measurements have been made to characterize patterned organic light-emitting-diode (OLED) substrates comprising indium-tin-oxide and a photoresist, both of which are modified by treatment with oxygen and tetrafluoromethane in a radiofrequency (13.56 MHz) low-power (˜1 W) capacitively coupled plasma as a function of time. Correlations between the surface chemical compositions from XPS and the contact angle, θ, are evaluated in order that the wettability of very small areas may be predicted. Very clear correlations for both the indium-tin-oxide and the photoresist surfaces are obtained enabling the prediction of the contact angles for these plasma-treated OLED materials from XPS data to a standard uncertainty of 9% in cos θ. These correlations need to be extended to a wider range of compositions in order to establish the physicochemical properties of particular surface functional groups that control water contact angles by this method.

  10. Surface Termination Conversion during SrTiO3 Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Baeumer, Christoph; Xu, Chencheng; Gunkel, Felix; Raab, Nicolas; Heinen, Ronja Anika; Koehl, Annemarie; Dittmann, Regina

    2015-07-01

    Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques. This report will demonstrate that the analysis of angle dependent X-ray photoelectron intensity ratios provides a unique tool to determine both termination and stoichiometry simultaneously in a straightforward experiment. Fitting the experimental angle dependence with a simple analytical model directly yields both values. The model is calibrated through the determination of the termination of SrTiO3 single crystals after systematic pulsed laser deposition of sub-monolayer thin films of SrO. We then use the model to demonstrate that during homoepitaxial SrTiO3 growth, excess Sr cations are consumed in a self-organized surface termination conversion before cation defects are incorporated into the film. We show that this termination conversion results in insulating properties of interfaces between polar perovskites and SrTiO3 thin films. These insights about oxide thin film growth can be utilized for interface engineering of oxide heterostructures. In particular, they suggest a recipe for obtaining two-dimensional electron gases at thin film interfaces: SrTiO3 should be deposited slightly Ti-rich to conserve the TiO2-termination.

  11. Surface properties of hydrous manganite (gamma-MnOOH). A potentiometric, electroacoustic, and X-ray photoelectron spectroscopy study.

    PubMed

    Ramstedt, Madeleine; Andersson, Britt M; Shchukarev, Andrei; Sjöberg, Staffan

    2004-09-14

    The acid-base characteristics of the manganite (gamma-MnOOH) surface have been studied at pH above 6, where dissolution is negligible. Synthetic microcrystalline particles of manganite were used in the experiments. From potentiometric titrations, electrophoretic mobility measurements, and X-ray photoelectron spectroscopy (XPS), a one pK(a) model was constructed that describes the observed behavior. The data show no ionic strength effect at pH < 8.2, which is the pH at the isoelectric point (pH(iep)), but ionic strength effects were visible above this pH. To explain these observations, Na(+) ions were suggested to form a surface complex. The following equilibria were established: =MnOH(2)(+1/2) right harpoon over left harpoon =MnOH(-)(1/2) + H(+), log beta(0) (intr.) = -8.20; =MnOH(2)(+1/2) + Na(+) right harpoon over left harpoon =MnOHNa(+1/2) + H(+), log beta(0) (intr.) = -9.64. The excess of Na(+) at the surface was supported by XPS measurements of manganite suspensions containing 10 mM NaCl. The dielectric constant of synthetic manganite powder was also determined in this study.

  12. Quantitative determination of the oxidation state of iron in biotite using x-ray photoelectron spectroscopy: II. In situ analyses

    SciTech Connect

    Raeburn, S.P. |; Ilton, E.S.; Veblen, D.R.

    1997-11-01

    X-ray photoelectron spectroscopy (XPS) was used to determine Fe(III)/{Sigma}Fe in individual biotite crystals in thin sections of ten metapelites and one syenite. The in situ XPS analyses of Fe(III)/{Sigma}Fe in biotite crystals in the metapelites were compared with published Fe(III)/{Sigma}Fe values determined by Moessbauer spectroscopy (MS) for mineral separates from the same hand samples. The difference between Fe(III)/{Sigma}Fe by the two techniques was greatest for samples with the lowest Fe(III)/{Sigma}Fe (by MS). For eight metamorphic biotites with Fe(III)/{Sigma}Fe = 9-27% comparison of the two techniques yielded a linear correlation of r = 0.94 and a statistically acceptable fit of [Fe(III)/{Sigma}Fe]{sub xps} = [Fe(III)/{Sigma}Fe]{sub ms}. The difference between Fe(III)/{Sigma}Fe by the two techniques was greater for two samples with Fe(III)/{Sigma}Fe {le} 6% (by MS). For biotite in the syenite sample, Fe(III)/{Sigma}Fe determined by both in situ XPS and bulk wet chemistry/electron probe microanalysis were similar. This contribution demonstrates that XPS can be used to analyze bulk Fe(III)/{Sigma}Fe in minerals in thin sections when appropriate precautions taken to avoid oxidation of the near-surface during preparation of samples. 25 refs., 3 figs., 4 tabs.

  13. An XPS study of the stability of Fomblin Z25 on the native oxide of aluminum. [x ray photoelectron spectroscopy

    NASA Technical Reports Server (NTRS)

    Herrera-Fierro, Pilar; Pepper, Stephen V.; Jones, William R.

    1991-01-01

    Thin films of Fomblin Z25, a perfluoropolyalkylether lubricant, were vapor deposited onto clean, oxidized aluminum and sapphire surfaces, and their behavior at different temperatures was studied using x ray photoelectron spectroscopy (XPS) and thermal desorption spectroscopy (TDS). It was found that the interfacial fluid molecules decompose on the native oxide at room temperature, and continue to decompose at elevated temperatures, as previous studies had shown to occur on clean metal. TDS indicated that different degradation mechanisms were operative for clean and oxidized aluminum. On sapphire substrates, no reaction was observed at room temperature. Our conclusion is that the native oxide of aluminum is neither passive nor protective towards Fomblin Z25. At high temperatures (150 C) degradation of the polymer on sapphire produced a debris layer at the interface with a chemical composition similar to the one formed on aluminum oxide. Rubbing a Fomblin film on a single crystal sapphire also induced the decomposition of the lubricant in contact with the interface and the formulation of a debris layer.

  14. In situ x-ray photoelectron spectroscopy studies of gas/solidinterfaces at near-ambient conditions

    SciTech Connect

    Bluhm, Hendrik; Havecker, Michael; Knop-Gericke, Axel; Kiskinova,Maya; Schlogl, Robert; Salmeron, Miquel

    2007-12-03

    X-ray photoelectron spectroscopy (XPS) is a quantitative, chemically specific technique with a probing depth of a few angstroms to a few nanometers. It is therefore ideally suited to investigate the chemical nature of the surfaces of catalysts. Because of the scattering of electrons by gas molecules, XPS is generally performed under vacuum conditions. However, for thermodynamic and/or kinetic reasons, the catalyst's chemical state observed under vacuum reaction conditions is not necessarily the same as that of a catalyst under realistic operating pressures. Therefore, investigations of catalysts should ideally be performed under reaction conditions, i.e., in the presence of a gas or gas mixtures. Using differentially pumped chambers separated by small apertures, XPS can operate at pressures of up to 1 Torr, and with a recently developed differentially pumped lens system, the pressure limit has been raised to about 10 Torr. Here, we describe the technical aspects of high-pressure XPS and discuss recent applications of this technique to oxidation and heterogeneous catalytic reactions on metal surfaces.

  15. Electrochemical anodic oxidation of nitrogen doped carbon nanowall films: X-ray photoelectron and Micro-Raman spectroscopy study

    NASA Astrophysics Data System (ADS)

    Achour, A.; Vizireanu, S.; Dinescu, G.; Le Brizoual, L.; Djouadi, M.-A.; Boujtita, M.

    2013-05-01

    Unintentional nitrogen doped carbon nanowall (CNW) films were oxidized through anodic polarization in different applied potential windows, in a mild neutral K2SO4 electrolyte solution. Applied potentials in the range of [0-1], [0-1.5] and [0-2] V vs. SCE were explored. The films were characterized with X-ray photoelectron (XPS) and Micro-Raman spectroscopy, in order to investigate the surface chemistry and structural changes after treatment, respectively. The XPS analysis revealed that this electrochemical treatment leads to an increase of oxygen functional groups, and influences the nitrogen proportion and bonding configuration (such as pyridinic/pyridonic nitrogen) on the film surface at room temperature. In particular, an obvious enhancement of pyrrolic/pyridonic nitrogen doping of CNWs via electrochemical cycling in the range of [0-1.5] and [0-2] V vs. SCE was achieved. Such enhancement happened, because of the oxidation of nitrogen atoms in pyridine as a result of OH ions injection upon electrochemical cycling. Micro-Raman analysis indicates structural quality degradation with increasing the applied potential window. Moreover, the electrochemical capacitance of CNW films was increased after treatment in the range of [0-1] and [0-1.5] and decreased in the range of [0-2] V vs. SCE. The results show that harsh oxidation happened in the range [0-2] V.

  16. UV-Raman spectroscopy, X-ray photoelectron spectroscopy, and temperature programmed desorption studies of model and bulk heterogeneous catalysts

    SciTech Connect

    Tewell, Craig Richmond

    2002-01-01

    X-ray photoelectron spectroscopy (XPS) and Temperature Programmed Desorption (TPD) have been used to investigate the surface structure of model heterogeneous catalysts in ultra-high vacuum (UHV). UV-Raman spectroscopy has been used to probe the structure of bulk model catalysts in ambient and reaction conditions. The structural information obtained through UV-Raman spectroscopy has been correlated with both the UHV surface analysis and reaction results. The present day propylene and ethylene polymerization catalysts (Ziegler-Natta catalysts) are prepared by deposition of TiCl4 and a Al(Et)3 co-catalyst on a microporous Mg-ethoxide support that is prepared from MgCl2 and ethanol. A model thin film catalyst is prepared by depositing metallic Mg on a Au foil in a UHV chamber in a background of TiCl4 in the gas phase. XPS results indicate that the Mg is completely oxidized to MgCl2 by TiCl4 resulting in a thin film of MgCl2/TiClx, where x = 2, 3, and 4. To prepare an active catalyst, the thin film of MgCl2/TiClx on Au foil is enclosed in a high pressure cell contained within the UHV chamber and exposed to ~1 Torr of Al(Et)3.

  17. X-ray photoelectron spectroscopy and transmission electron microscopy analysis of silver-coated gold nanorods designed for bionanotechnology applications

    NASA Astrophysics Data System (ADS)

    Watanabe, Fumiya; Nima, Zeid A.; Honda, Takumi; Mitsuhara, Masatoshi; Nishida, Minoru; Biris, Alexandru S.

    2017-01-01

    Multicomponent nano-agents were designed and built via a core-shell approach to enhance their surface enhanced Raman scattering (SERS) signals. These nano-agents had 36 nm × 12 nm gold nanorod cores coated by 4 nm thick silver shell films and a subsequent thin bifunctional thiolated polyethylene glycol (HS-PEG-COOH) layer. Ambient time-lapsed SERS signal measurements of these functionalized nanorods taken over a two-week period indicated no signal degradation, suggesting that large portions of the silver shells remained in pure metallic form. The morphology of the nanorods was characterized by transmission electron microscopy (TEM) and ultra-high resolution scanning TEM. X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were utilized to assess the oxidation states of the silver shells covered by HS-PEG-COOH. The binding energies of Ag 3d XPS spectra yielded very small chemical shifts with oxidation; however, the AES peak shapes gave meaningful information about the extent of oxidation undergone by the nano-agent. While the silver shells without HS-PEG-COOH coatings oxidized significantly, the silver shells with HS-PEG-COOH remained predominantly metallic. In fact, six month-old samples still retained mostly metallic silver shells. These findings further demonstrate the stability and longevity of the nanostructures, indicating their significant potential as plasmonically active agents for highly sensitive detection in various biological systems, including cancer cells, tissues, or even organisms.

  18. A SIMS (secondary ion mass spectrometry) and XPS (X-ray photoelectron spectroscopy) study of dissolving plagioclase

    SciTech Connect

    Muir, I.J. ); Bancroft, G.M.; Nesbitt, H.W. ); Shotyk, W. )

    1990-08-01

    In an earlier report, the authors showed that altered layers formed on the surface of dissolving labradorite feldspar grains, and that the thickness of these layers (up to hundreds of angstroms) is strongly dependent on the pH of the reactant solution. In this paper, they show that the thickness of these altered layers also depends strongly on the composition of the plagioclase feldspar. Secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS) have been used to characterize these altered layers. During dissolution, Ca and Al are removed from the solid material to form an altered layer residually enriched in Si with very similar profiles for Ca and Al. In acidic solutions (pH 3.5) for 90 days, the altered layers increase in thickness from a few hundred angstroms to many hundred angstroms in the order: albite < oligoclase < labradorite < bytownite. These results emphasize the central role of hydrolysis of the bridging Si-O-Al bonds in the initial weathering process. Analysis by scanning electron microscopy (SEM) does not provide any evidence for the growth of secondary phases. Extensive dissolution features (etch pits) were observed on many of the reacted surfaces.

  19. Characterization of photocatalytic TiO2 powder under varied environments using near ambient pressure X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Krishnan, Padmaja; Liu, Minghui; Itty, Pierre A.; Liu, Zhi; Rheinheimer, Vanessa; Zhang, Min-Hong; Monteiro, Paulo J. M.; Yu, Liya E.

    2017-02-01

    Consecutive eight study phases under the successive presence and absence of UV irradiation, water vapor, and oxygen were conducted to characterize surface changes in the photocatalytic TiO2 powder using near-ambient-pressure X-ray photoelectron spectroscopy (XPS). Both Ti 2p and O 1s spectra show hysteresis through the experimental course. Under all the study environments, the bridging hydroxyl (OHbr) and terminal hydroxyl (OHt) are identified at 1.1–1.3 eV and 2.1–2.3 eV above lattice oxygen, respectively. This enables novel and complementary approach to characterize reactivity of TiO2 powder. The dynamic behavior of surface-bound water molecules under each study environment is identified, while maintaining a constant distance of 1.3 eV from the position of water vapor. In the dark, the continual supply of both water vapor and oxygen is the key factor retaining the activated state of the TiO2 powder for a time period. Two new surface peaks at 1.7–1.8 and 4.0–4.2 eV above lattice oxygen are designated as peroxides (OOH/H2O2) and H2O2 dissolved in water, respectively. The persistent peroxides on the powder further explain previously observed prolonged oxidation capability of TiO2 powder without light irradiation.

  20. X-ray photoelectron and scanning Auger electron spectroscopy study of electrodeposited ZnCr coatings on steel.

    PubMed

    Itani, H; Duchoslav, J; Arndt, M; Steck, T; Gerdenitsch, J; Faderl, J; Preis, K; Winkler, W; Stifter, D

    2012-05-01

    Zn-Cr alloyed coatings electrochemically deposited are of high interest for leading steel manufacturing companies because of their novel properties and high corrosion resistance compared with conventional Zn coatings on steel. For tuning and optimizing the properties of the electrodeposited Zn-Cr coatings, a broad range of the deposition conditions must be studied. For this reason, two different types of material were investigated in this study, one with a low electrolyte temperature and one with an elevated electrolyte pH, compared with the standard values. Because different corrosion performance and delamination behaviour of the layers were observed for the two types, advanced surface analysis was conducted to understand the origin of this behaviour and to discover differences in the formation of the coatings. The topmost surface, the shallow subsurface region, and the whole bulk down to the coating-steel interface surface were analysed in detail by X-ray photoelectron spectroscopy (XPS) and high-resolution scanning Auger electron spectroscopy to determine the elemental and the chemical composition. For better understanding of the resulting layer structure, multiple reference samples and materials were measured and their Auger and XPS spectra were fitted to the experimental data. The results showed that one coating type is composed of metallic Zn and Cr, with oxide residing only on the surface and interface, whereas the other type contains significant amounts of Zn and Cr oxides throughout the whole coating thickness.

  1. Growth kinetics of CaF2/Si(111) heteroepitaxy: An x-ray photoelectron diffraction study

    NASA Astrophysics Data System (ADS)

    Denlinger, J. D.; Rotenberg, Eli; Hessinger, U.; Leskovar, M.; Olmstead, Marjorie A.

    1995-02-01

    Kinetic variations of the initial stages of CaF2 growth on Si(111) by molecular-beam epitaxy are studied with the in situ combination of x-ray photoelectron spectroscopy and diffraction. After the formation of a chemically reacted interface layer, the morphology of the subsequent bulk layers is found to be dependent on the substrate temperature and incident flux rate, as well as the initial interface structure. For substrate temperatures above ~600 °C, subsequent layers do not easily wet the interface layer, and a transition is observed from a three-dimensional island formation at low flux to a laminar growth following the coalescence of bilayer islands at higher flux. At lower substrate temperatures (~450 °C), a different stoichiometry and structure of the interface layer leads to laminar growth at all fluxes, but with a different bulk nucleation behavior. Crystalline heteroepitaxy is not observed when growth initiates at room temperature, but homoepitaxy does proceed at room temperature if the first few layers are deposited at a high temperature. The different growth regimes are discussed in terms of a kinetic model separating step and terrace nucleation where, contrary to homoepitaxy, step nucleation leads to islanded growth.

  2. Revealing chemical ordering in Pt-Co nanoparticles using electronic structure calculations and X-ray photoelectron spectroscopy.

    PubMed

    Kovács, Gábor; Kozlov, Sergey M; Matolínová, Iva; Vorokhta, Mykhailo; Matolín, Vladimír; Neyman, Konstantin M

    2015-11-14

    The high catalytic activity of Pt-Co nanoalloys in oxygen reduction and other reactions is usually attributed to their Pt-rich surfaces. However, identification of the precise near-surface structure is by no means easily achievable experimentally. In this work we systematically analyzed the chemical ordering and surface composition of PtXCo(79-X) and PtXCo(140-X) bimetallic nanoparticles by means of a recently developed method based on topological energy expressions and electronic structure calculations. Pt is found to segregate on the surface, especially on corner and edge sites, forming a one atomic layer thick skin independent of the size and composition of the nanoparticle. In turn, the subsurface shell of the particle is composed mostly of Co, whereas the core area has a mixed composition, which depends on the overall stoichiometry. The formation of an outer Pt shell is corroborated by thoroughly analyzed data of X-ray photoelectron spectroscopy experiments performed with various photon energies on annealed Pt-Co particles prepared in vacuum by magnetron sputtering. The core-shell structure of Pt-Co particles is calculated to be more stable than the respective L10 structure. The obtained topological energy expressions are shown to depend only very moderately on the nanoparticle size, which allowed us to apply them to determine the ordering in ∼4 nm big PtXCo(1463-X) species. The presented results deepen our understanding of the intrinsic structure of Pt-Co nanoparticles depending on their size and composition.

  3. Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Singh, Bhupinder; Diwan, Anubhav; Jain, Varun; Herrera-Gomez, Alberto; Terry, Jeff; Linford, Matthew R.

    2016-11-01

    Peak fitting is an essential part of X-ray photoelectron spectroscopy (XPS) narrow scan analysis, and the Literature contains both good and bad examples of peak fitting. A common cause of poor peak fitting is the inclusion of too many fit parameters, often without a sound chemical and/or physical basis for them, and/or the failure to reasonably constrain them. Under these conditions, fit parameters are often correlated, and therefore lacking in statistical meaning. Here we introduce the uniqueness plot as a simple graphical tool for identifying bad peak fits in XPS, i.e., fit parameter correlation. These plots are widely used in spectroscopic ellipsometry. We illustrate uniqueness plots with two data sets: a C 1s narrow scan from ozone-treated carbon nanotube forests and an Si 2p narrow scan from an air-oxidized silicon wafer. For each fit, we consider different numbers of parameters and constraints on them. As expected, the uniqueness plots are parabolic when fewer fit parameters and/or more constraints are applied. However, they fan out and eventually become horizontal lines as more unconstrained parameters are included in the fits. Uniqueness plots are generated by plotting the chi squared (χ2) value for a fit vs. a systematically varied value of a parameter in the fit. The Abbe criterion is also considered as a figure of merit for uniqueness plots in the Supporting Information. We recommend that uniqueness plots be used by XPS practitioners for identifying inappropriate peak fits.

  4. Compositional depth profile of a native oxide LPCVD MNOS structure using X-ray photoelectron spectroscopy and chemical etching

    NASA Technical Reports Server (NTRS)

    Wurzbach, J. A.; Grunthaner, F. J.

    1983-01-01

    It is pointed out that there is no report of an unambiguous analysis of the composition and interfacial structure of MNOS (metal-nitride oxide semiconductor) systems, despite the technological importance of these systems. The present investigation is concerned with a study of an MNOS structure on the basis of a technique involving the use of X-ray photoelectron spectroscopy (XPS) with a controlled stopped-flow chemical-etching procedure. XPS is sensitive to the structure of surface layers, while stopped-flow etching permits the controlled removal of overlying material on a scale of atomic layers, to expose new surface layers as a function of thickness. Therefore, with careful analysis of observed intensities at measured depths, this combination of techniques provides depth resolution between 5 and 10 A. According to the obtained data there is intact SiO2 at the substrate interface. There appears to be a thin layer containing excess bonds to silicon on top of the SiO2.

  5. Band offsets of TiZnSnO/Si heterojunction determined by x-ray photoelectron spectroscopy

    SciTech Connect

    Sun, R. J.; Jiang, Q. J.; Yan, W. C.; Feng, L. S.; Lu, B.; Ye, Z. Z.; Li, X. F.; Li, X. D.; Lu, J. G.

    2014-09-28

    X-ray photoelectron spectroscopy (XPS) was utilized to measure the valence band offset (ΔE{sub V}) of the TiZnSnO (TZTO)/Si heterojunction. TZTO films were deposited on Si (100) substrates using magnetron sputtering at room temperature. By using the Zn 2p{sub 3/2} and Sn 3d{sub 5/2} energy levels as references, the value of ΔE{sub V} was calculated to be 2.69 ± 0.1 eV. Combining with the experimental optical energy band gap of 3.98 eV for TZTO extracted from the UV-vis transmittance spectrum, the conduction band offset (ΔE{sub C}) was deduced to be 0.17 ± 0.1 eV at the interface. Hence, the energy band alignment of the heterojunction was determined accurately, showing a type-I form. This will be beneficial for the design and application of TZTO/Si hybrid devices.

  6. Surface Termination Conversion during SrTiO3 Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

    PubMed Central

    Baeumer, Christoph; Xu, Chencheng; Gunkel, Felix; Raab, Nicolas; Heinen, Ronja Anika; Koehl, Annemarie; Dittmann, Regina

    2015-01-01

    Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques. This report will demonstrate that the analysis of angle dependent X-ray photoelectron intensity ratios provides a unique tool to determine both termination and stoichiometry simultaneously in a straightforward experiment. Fitting the experimental angle dependence with a simple analytical model directly yields both values. The model is calibrated through the determination of the termination of SrTiO3 single crystals after systematic pulsed laser deposition of sub-monolayer thin films of SrO. We then use the model to demonstrate that during homoepitaxial SrTiO3 growth, excess Sr cations are consumed in a self-organized surface termination conversion before cation defects are incorporated into the film. We show that this termination conversion results in insulating properties of interfaces between polar perovskites and SrTiO3 thin films. These insights about oxide thin film growth can be utilized for interface engineering of oxide heterostructures. In particular, they suggest a recipe for obtaining two-dimensional electron gases at thin film interfaces: SrTiO3 should be deposited slightly Ti-rich to conserve the TiO2-termination. PMID:26189436

  7. X-ray Photoelectron Spectroscopy of Pyridinium-Based Ionic Liquids: Comparison to Imidazolium- and Pyrrolidinium-Based Analogues.

    PubMed

    Men, Shuang; Mitchell, Daniel S; Lovelock, Kevin R J; Licence, Peter

    2015-07-20

    We investigate eight 1-alkylpyridinium-based ionic liquids of the form [Cn Py][A] by using X-ray photoelectron spectroscopy (XPS). The electronic environment of each element of the ionic liquids is analyzed. In particular, a reliable fitting model is developed for the C 1s region that applies to each of the ionic liquids. This model allows the accurate charge correction of binding energies and the determination of reliable and reproducible binding energies for each ionic liquid. Shake-up/off phenomena are determinedfor both C 1s and N 1s spectra. The electronic interaction between cations and anions is investigated for both simple ionic liquids and an example of an ionic-liquid mixture; the effect of the anion on the electronic environment of the cation is also explored. Throughout the study, a detailed comparison is made between [C8 Py][A] and analogues including 1-octyl-1-methylpyrrolidinium- ([C8 C1 Pyrr][A]), and 1-octyl-3-methylimidazolium- ([C8 C1 Im][A]) based samples, where X is common to all ionic liquids.

  8. Depth profiling of organic films with X-ray photoelectron spectroscopy using C60+ and Ar+ co-sputtering.

    PubMed

    Yu, Bang-Ying; Chen, Ying-Yu; Wang, Wei-Ben; Hsu, Mao-Feng; Tsai, Shu-Ping; Lin, Wei-Chun; Lin, Yu-Chin; Jou, Jwo-Huei; Chu, Chih-Wei; Shyue, Jing-Jong

    2008-05-01

    By sputtering organic films with 10 kV, 10 nA C60+ and 0.2 kV, 300 nA Ar+ ion beams concurrently and analyzing the newly exposed surface with X-ray photoelectron spectroscopy, organic thin-film devices including an organic light-emitting diode and a polymer solar cell with an inverted structure are profiled. The chemical composition and the structure of each layer are preserved and clearly observable. Although C60+ sputtering is proven to be useful for analyzing organic thin-films, thick organic-devices cannot be profiled without the low-energy Ar+ beam co-sputtering due to the nonconstant sputtering rate of the C60+ beam. Various combinations of ion-beam doses are studied in this research. It is found that a high dosage of the Ar+ beam interferes with the C60+ ion beam, and the sputtering rate decreases with increasing the total ion current. The results suggest that the low-energy single-atom projectile can disrupt the atom deposition from the cluster ion beams and greatly extend the application of the cluster ion-sputtering. By achievement of a steady sputtering rate while minimizing the damage accumulation, this research paves the way to profiling soft matter and organic electronics.

  9. Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

    NASA Astrophysics Data System (ADS)

    Motoki, Keisuke; Miyazawa, Yu; Kobayashi, Daisuke; Ikegami, Masashi; Miyasaka, Tsutomu; Yamamoto, Tomoyuki; Hirose, Kazuyuki

    2017-02-01

    The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

  10. Tracking the amorphous to epitaxial transition in RF-sputtered cubic BFO-STO heterojunctions by means of X-ray photoelectron diffraction

    NASA Astrophysics Data System (ADS)

    Giampietri, Alessio; Drera, Giovanni; Píš, Igor; Magnano, Elena; Sangaletti, Luigi

    2016-09-01

    The epitaxial growth of cubic BiFeO3 ultrathin films on SrTiO3 (001) substrates by off-axis RF sputtering is demonstrated, suitable to X-ray spectroscopies interface investigation. X-ray photoelectron diffraction is used as a tool to probe the long-range crystal order and to track the transition from amorphous to epitaxial growth as a function of deposition parameters. Further spectroscopic measurements, in particular, X-ray linear dichroism on the Fe L 3 , 2 edge, confirm the heteroepitaxial growth of BiFeO3 and clearly indicate a 3+ valence state for the iron cation. Finally, XPS is used to reconstruct the band alignment diagram, which results in a staggered configuration with a remarkable energy shift of the SrTiO3 band edges which can ultimately favor the n-type doping of SrTiO3.

  11. Chemical bonding and electronic structures of microcline, orthoclase and the plagioclase series by X-ray photoelectron spectroscopy.

    PubMed

    Kloprogge, J Theo; Wood, Barry J

    2015-02-25

    A detailed analysis was undertaken of the X-ray photoelectron spectra obtained from microcline, orthoclase and several samples of plagioclase with varying Na/Ca ratio. Comparison of the spectra was made based on the chemical bonding and structural differences in the Al- and Si-coordination within each specimen. The spectra for Si 2p and Al 2p vary with the change in symmetry between microcline and orthoclase, while in plagioclase an increase in Al-O-Si linkages results in a small but observable decrease in binding energy. The overall shapes of the O 1s peaks observed in all spectra are similar and show shifts similar to those observed for Si 2p and Al 2p. The lower-VB spectra for microcline and orthoclase are similar intermediate between α-SiO2 and α-Al2O3 in terms of binding energies. In the plagioclase series increasing coupled substitution of Na and Si for Ca and Al results in a change of the overall shape of the spectra, showing a distinct broadening associated with the presence of two separate but overlapping bands similar to the 21 eV band observed for quartz and the 23 eV band observed for corundum. The bonding character for microcline and orthoclase is more covalent than that of α-Al2O3, but less than that of α-SiO2. In contrast, the plagioclase samples show two distinct bonding characters that are comparable with those of α-SiO2 and α-Al2O3.

  12. X-ray absorption and photoelectron spectroscopic study of plasma-nitrided SiO{sub 2} film

    SciTech Connect

    Song, H.J.; Shin, H.J.; Chung, Youngsu; Lee, J.C.; Lee, M.K.

    2005-06-01

    Plasma-nitrided SiO{sub 2} thin film has been analyzed by synchrotron-radiation-based x-ray absorption and photoelectron spectroscopies (XAS and XPS). High-resolution N 1s XAS and N 1s, O 1s, and Si 2p XPS spectral changes were obtained for different annealing temperatures. N 1s XPS and XAS spectra show that at room temperature, besides the main species of N[Si(O-){sub 3-x}]{sub 3}, there exist free moleculelike N{sub 2} and HN[Si(O-){sub 3}]{sub 2}, H{sub 2}NSi(O-){sub 3}, and N-Si{sub 2}O species with surface contaminants. The spectral intensities of the N{sub 2} and the HN[Si(O-){sub 3}]{sub 2}, H{sub 2}NSi(O-){sub 3}, and N-Si{sub 2}O species decrease as the annealing temperature increases, and finally the nitrogen exists dominantly in the form of N[Si(O){sub 3}]{sub 3} species above 820 K, indicating out-diffusion of molecular N{sub 2} and structural reconstruction to form a stable structure upon annealing. The Si 2p and O 1s XPS spectra show that Si{sup >4+} 2p peak and O 1s peak appear at 103.7 and 534.0 eV, respectively, which are higher binding energies than those of thermally grown oxynitride films with lower coverage on silicon. Upon annealing the sample, these peaks shift towards lower binding energy; {approx}0.3 eV for Si{sup >4+} and 0.4 eV for O 1s. The causes of the peaks appearance at relatively higher binding energy and the peak shift upon annealing are discussed.

  13. X-ray photoelectron spectroscopy study of the growth kinetics of biomimetically grown hydroxyapatite thin-film coatings

    NASA Astrophysics Data System (ADS)

    McLeod, K.; Kumar, S.; Dutta, N. K.; Smart, R. St. C.; Voelcker, N. H.; Anderson, G. I.

    2010-09-01

    Hydroxyapatite (HA) thin-film coatings grown biomimetically using simulated body fluid (SBF) are desirable for a range of applications such as improved fixation of fine- and complex-shaped orthopedic and dental implants, tissue engineering scaffolds and localized and sustained drug delivery. There is a dearth of knowledge on two key aspects of SBF-grown HA coatings: (i) the growth kinetics over short deposition periods, hours rather than weeks; and (ii) possible difference between the coatings deposited with and without periodic SBF replenishment. A study centred on these aspects is reported. X-ray photoelectron spectroscopy (XPS) has been used to study the growth kinetics of SBF-grown HA coatings for deposition periods ranging from 0.5 h to 21 days. The coatings were deposited with and without periodic replenishment of SBF. The XPS studies revealed that: (i) a continuous, stable HA coating fully covered the titanium substrate after a growth period of 13 h without SBF replenishment; (ii) thicker HA coatings about 1 μm in thickness resulted after a growth period of 21 days, both with and without SBF replenishment; and (iii) the Ca/P ratio at the surface of the HA coating was significantly lower than that in its bulk. No significant difference between HA grown with and without periodic replenishment of SBF was found. The coatings were determined to be carbonated, a characteristic desirable for improved implant fixation. The atomic force and scanning electron microscopies results suggested that heterogeneous nucleation and growth are the primary deposition mode for these coatings. Primary osteoblast cell studies demonstrated the biocompatibility of these coatings, i.e., osteoblast colony coverage of approximately 80%, similar to the control substrate (tissue culture polystyrene).

  14. Chemical Analysis of the Interface in Bulk-Heterojunction Solar Cells by X-ray Photoelectron Spectroscopy Depth Profiling.

    PubMed

    Busby, Yan; List-Kratochvil, Emil J W; Pireaux, Jean-Jacques

    2017-02-01

    Despite the wide use of blends combining an organic p-type polymer and molecular fullerene-based electron acceptor, the proper characterization of such bulk heterojunction materials is still challenging. To highlight structure-to-function relations and improve the device performance, advanced tools and strategies need to be developed to characterize composition and interfaces with sufficient accuracy. In this work, high-resolution X-ray photoelectron spectroscopy (XPS) is combined with very low energy argon ion beam sputtering to perform a nondestructive depth profile chemical analysis on full Al/P3HT:PCBM/PEDOT:PSS/ITO (P3HT, poly(3-hexylthiophene); PCBM, [6,6]-phenyl-C61-butyric acid methyl ester; PEDOT, poly(3,4-ethylenedioxythiophene; PSS, polystyrenesulfonate; ITO, indium tin oxide) bulk-heterojunction solar cell device stacks. Key information, such as P3HT and PCBM composition profiles and Al-PCBM chemical bonding, are deduced in this basic device structure. The interface chemical analysis allows us to evidence, with unprecedented accuracy, the inhomogeneous distribution of PCBM, characterized by a strong segregation toward the top metal electrode. The chemical analysis high-resolution spectra allows us to reconstruct P3HT/PCBM ratio through the active layer depth and correlate with the device deposition protocol and performance. Results evidence an inhomogeneous P3HT/PCBM ratio and poorly controllable PCBM migration, which possibly explains the limited light-to-power conversion efficiency in this basic device structure. The work illustrates the high potential of XPS depth profile analysis for studying such organic/inorganic device stacks.

  15. Angle resolved x-ray photoelectron spectroscopy (ARXPS) analysis of lanthanum oxide for micro-flexography printing

    NASA Astrophysics Data System (ADS)

    Hassan, S.; Yusof, M. S.; Embong, Z.; Maksud, M. I.

    2016-01-01

    Micro-flexography printing was developed in patterning technique from micron to nano scale range to be used for graphic, electronic and bio-medical device on variable substrates. In this work, lanthanum oxide (La2O3) has been used as a rare earth metal candidate as depositing agent. This metal deposit was embedded on Carbon (C) and Silica (Si) wafer substrate using Magnetron Sputtering technique. The choose of Lanthanum as a target is due to its wide application in producing electronic devices such as thin film battery and printed circuit board. The La2O3 deposited on the surface of Si wafer substrate was then analyzed using Angle Resolve X-Ray Photoelectron Spectroscopy (ARXPS). The position for each synthetic component in the narrow scan of Lanthanum (La) 3d and O 1s are referred to the electron binding energy (eV). The La 3d narrow scan revealed that the oxide species of this particular metal is mainly contributed by La2O3 and La(OH)3. The information of oxygen species, O2- component from O 1s narrow scan indicated that there are four types of species which are contributed from the bulk (O2-), two chemisorb component (La2O3) and La(OH)3 and physisorp component (OH). Here, it is proposed that from the adhesive and surface chemical properties of La, it is suitable as an alternative medium for micro-flexography printing technique in printing multiple fine solid lines at nano scale. Hence, this paper will describe the capability of this particular metal as rare earth metal for use in of micro-flexography printing practice. The review of other parameters contributing to print fine lines will also be described later.

  16. Quantitative X-ray photoelectron spectroscopy-based depth profiling of bioleached arsenopyrite surface by Acidithiobacillus ferrooxidans

    NASA Astrophysics Data System (ADS)

    Zhu, Tingting; Lu, Xiancai; Liu, Huan; Li, Juan; Zhu, Xiangyu; Lu, Jianjun; Wang, Rucheng

    2014-02-01

    In supergene environments, microbial activities significantly enhance sulfide oxidation and result in the release of heavy metals, causing serious contamination of soils and waters. As the most commonly encountered arsenic mineral in nature, arsenopyrite (FeAsS) accounts for arsenic contaminants in various environments. In order to investigate the geochemical behavior of arsenic during microbial oxidation of arsenopyrite, (2 3 0) surfaces of arsenopyrite slices were characterized after acidic (pH 2.00) and oxidative decomposition with or without an acidophilic microorganism Acidithiobacillus ferrooxidans. The morphology as well as chemical and elemental depth profiles of the oxidized arsenopyrite surface were investigated by scanning electron microscopy and X-ray photoelectron spectroscopy. With the mediation of bacteria, cell-shaped and acicular pits were observed on the reacted arsenopyrite surface, and the concentration of released arsenic species in solution was 50 times as high as that of the abiotic reaction after 10 days reaction. Fine-scale XPS depth profiles of the reacted arsenopyrite surfaces after both microbial and abiotic oxidation provided insights into the changes in chemical states of the elements in arsenopyrite surface layers. Within the 450 nm surface layer of abiotically oxidized arsenopyrite, Fe(III)-oxides appeared and gradually increased towards the surface, and detectable sulfite and monovalent arsenic appeared above 50 nm. In comparison, higher contents of ferric sulfate, sulfite, and arsenite were found in the surface layer of approximately 3 μm of the microbially oxidized arsenopyrite. Intermediates, such as Fe(III)-AsS and S0, were detectable in the presence of bacteria. Changes of oxidative species derived from XPS depth profiles show the oxidation sequence is Fe > As = S in abiotic oxidation, and Fe > S > As in microbial oxidation. Based on these results, a possible reaction path of microbial oxidation was proposed in a concept model.

  17. Angle resolved x-ray photoelectron spectroscopy (ARXPS) analysis of lanthanum oxide for micro-flexography printing

    SciTech Connect

    Hassan, S. Yusof, M. S. Maksud, M. I.; Embong, Z.

    2016-01-22

    Micro-flexography printing was developed in patterning technique from micron to nano scale range to be used for graphic, electronic and bio-medical device on variable substrates. In this work, lanthanum oxide (La{sub 2}O{sub 3}) has been used as a rare earth metal candidate as depositing agent. This metal deposit was embedded on Carbon (C) and Silica (Si) wafer substrate using Magnetron Sputtering technique. The choose of Lanthanum as a target is due to its wide application in producing electronic devices such as thin film battery and printed circuit board. The La{sub 2}O{sub 3} deposited on the surface of Si wafer substrate was then analyzed using Angle Resolve X-Ray Photoelectron Spectroscopy (ARXPS). The position for each synthetic component in the narrow scan of Lanthanum (La) 3d and O 1s are referred to the electron binding energy (eV). The La 3d narrow scan revealed that the oxide species of this particular metal is mainly contributed by La{sub 2}O{sub 3} and La(OH){sub 3}. The information of oxygen species, O{sup 2-} component from O 1s narrow scan indicated that there are four types of species which are contributed from the bulk (O{sup 2−}), two chemisorb component (La{sub 2}O{sub 3}) and La(OH){sub 3} and physisorp component (OH). Here, it is proposed that from the adhesive and surface chemical properties of La, it is suitable as an alternative medium for micro-flexography printing technique in printing multiple fine solid lines at nano scale. Hence, this paper will describe the capability of this particular metal as rare earth metal for use in of micro-flexography printing practice. The review of other parameters contributing to print fine lines will also be described later.

  18. Development of a technique to prevent radiation damage of chromate conversion coatings during X-ray photoelectron spectroscopic analysis

    NASA Astrophysics Data System (ADS)

    Chidambaram, Devicharan; Halada, Gary P.; Clayton, Clive R.

    2001-09-01

    Photoreduction of hydrated sodium dichromate in the presence of carbon compounds has been studied by X-ray photoelectron spectroscopy (XPS). XPS results show that sodium dichromate also undergoes thermal breakdown during analysis. The photochemical and thermal reduction appears to be prevented by cooling with liquid nitrogen and using hydrocarbon-free vacuum pumping conditions. A model for the photoreduction of dichromate has been put forward based on an earlier photoreduction model developed by this group. Using the insight gained from this work, chromium spectra obtained from XPS of chromate conversion coatings (CCCs) on AA2024-T3 aluminum alloy have for the first time been fitted with six species of chromium compounds. The Cr 2p spectra have been critically examined for photoreduction of the hexavalent species: tetravalent and trivalent decomposition products have been identified. To explain the observed photochemical breakdown in CCCs even when performed under clean pumping conditions and liquid nitrogen cooling, its has been verified that the reduction is partly due to the cyanide species present in the CCCs. Cooling with liquid nitrogen prevents the adsorbed water on the coating from reacting with Cr(IV) to form trivalent species as the water molecules are immobilized and kinetics are slowed. As the Cr(VI)/Cr(III) ratio is critical to the performance of the CCC, and its accurate determination by XPS has not formerly been possible due to the photoreduction of Cr(VI) to Cr(III), we present a reliable method by which XPS can be used in characterization of chromate conversion coatings.

  19. X-ray photoelectron spectroscopic study on interface bonding between Pt and Zn- and O-terminated ZnO

    SciTech Connect

    Yoshitake, Michiko; Nemsak, Slavomir; Blumentrit, Petr

    2013-03-15

    Interface bonding between Pt and Zn- and O-terminated ZnO surfaces was investigated by precise analysis of x-ray photoelectron spectra. The interfaces were formed by vapor depositing Pt onto the ZnO surfaces in ultrahigh vacuum. The changes in the Zn 2p{sub 3/2}, O 1s, Zn LMM Auger, and Pt 4f{sub 7/2} spectra upon Pt deposition were observed. The changes in the shape of the Zn LMM spectra and the shifts in the binding energy of Zn 2p{sub 3/2} and O 1s revealed that there was a metallic Zn component in the Zn LMM and Zn 2p{sub 3/2} spectra for Zn-terminated ZnO and a Pt-O component in the O 1s spectra for both Zn- and O-terminated ZnO. Peaks were fitted with multiple components accordingly. The binding energy shifts of Zn 2p{sub 3/2} and O 1s for the ZnO component were almost the same, which confirmed that the fitting was reasonable. From the fitting results, the interface bonding was concluded to be O-terminated, i.e., Zn-O-Pt bond formation occurred at the interface for both Zn- and O-terminated ZnO. This clearly demonstrated that the stable interface bonding occurring between Pt and ZnO is Zn-O-Pt bonding whether the ZnO substrate is initially Zn-terminated or O-terminated.

  20. Following the molecular motion of near-resonant excited CO on Pt(111): A simulated x-ray photoelectron diffraction study based on molecular dynamics calculations

    PubMed Central

    Greif, Michael; Nagy, Tibor; Soloviov, Maksym; Castiglioni, Luca; Hengsberger, Matthias; Meuwly, Markus; Osterwalder, Jürg

    2015-01-01

    A THz-pump and x-ray-probe experiment is simulated where x-ray photoelectron diffraction (XPD) patterns record the coherent vibrational motion of carbon monoxide molecules adsorbed on a Pt(111) surface. Using molecular dynamics simulations, the excitation of frustrated wagging-type motion of the CO molecules by a few-cycle pulse of 2 THz radiation is calculated. From the atomic coordinates, the time-resolved XPD patterns of the C 1s core level photoelectrons are generated. Due to the direct structural information in these data provided by the forward scattering maximum along the carbon-oxygen direction, the sequence of these patterns represents the equivalent of a molecular movie. PMID:26798798

  1. Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films

    NASA Astrophysics Data System (ADS)

    Greczynski, G.; Hultman, L.

    2016-11-01

    We present first self-consistent modelling of x-ray photoelectron spectroscopy (XPS) Ti 2p, N 1s, O 1s, and C 1s core level spectra with a cross-peak quantitative agreement for a series of TiN thin films grown by dc magnetron sputtering and oxidized to different extent by varying the venting temperature Tv of the vacuum chamber before removing the deposited samples. So-obtained film series constitute a model case for XPS application studies, where certain degree of atmosphere exposure during sample transfer to the XPS instrument is unavoidable. The challenge is to extract information about surface chemistry without invoking destructive pre-cleaning with noble gas ions. All TiN surfaces are thus analyzed in the as-received state by XPS using monochromatic Al Kα radiation (hν = 1486.6 eV). Details of line shapes and relative peak areas obtained from deconvolution of the reference Ti 2p and N 1 s spectra representative of a native TiN surface serve as an input to model complex core level signals from air-exposed surfaces, where contributions from oxides and oxynitrides make the task very challenging considering the influence of the whole deposition process at hand. The essential part of the presented approach is that the deconvolution process is not only guided by the comparison to the reference binding energy values that often show large spread, but in order to increase reliability of the extracted chemical information the requirement for both qualitative and quantitative self-consistency between component peaks belonging to the same chemical species is imposed across all core-level spectra (including often neglected O 1s and C 1s signals). The relative ratios between contributions from different chemical species vary as a function of Tv presenting a self-consistency check for our model. We propose that the cross-peak self-consistency should be a prerequisite for reliable XPS peak modelling as it enhances credibility of obtained chemical information, while relying

  2. Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films

    SciTech Connect

    Greczynski, Grzegorz Hultman, Lars; Petrov, Ivan; Greene, J. E.

    2015-09-15

    X-ray photoelectron spectroscopy (XPS) compositional analyses of materials that have been air exposed typically require ion etching in order to remove contaminated surface layers. However, the etching step can lead to changes in sample surface and near-surface compositions due to preferential elemental sputter ejection and forward recoil implantation; this is a particular problem for metal/gas compounds and alloys such as nitrides and oxides. Here, the authors use TiN as a model system and compare XPS analysis results from three sets of polycrystalline TiN/Si(001) films deposited by reactive magnetron sputtering in a separate vacuum chamber. The films are either (1) air-exposed for ≤10 min prior to insertion into the ultrahigh-vacuum (UHV) XPS system; (2) air-exposed and subject to ion etching, using different ion energies and beam incidence angles, in the XPS chamber prior to analysis; or (3) Al-capped in-situ in the deposition system prior to air-exposure and loading into the XPS instrument. The authors show that thin, 1.5–6.0 nm, Al capping layers provide effective barriers to oxidation and contamination of TiN surfaces, thus allowing nondestructive acquisition of high-resolution core-level spectra representative of clean samples, and, hence, correct bonding assignments. The Ti 2p and N 1s satellite features, which are sensitive to ion bombardment, exhibit high intensities comparable to those obtained from single-crystal TiN/MgO(001) films grown and analyzed in-situ in a UHV XPS system and there is no indication of Al/TiN interfacial reactions. XPS-determined N/Ti concentrations acquired from Al/TiN samples agree very well with Rutherford backscattering and elastic recoil analysis results while ion-etched air-exposed samples exhibit strong N loss due to preferential resputtering. The intensities and shapes of the Ti 2p and N 1s core level signals from Al/TiN/Si(001) samples do not change following long-term (up to 70 days) exposure to ambient conditions

  3. Beam Damage of Poly(Vinyl Chloride) [PVC] Film as Observed by X-ray Photoelectron Spectroscopy

    SciTech Connect

    Engelhard, Mark H.; Krishna, Abhilash; Kulkarni, Pranita B.; Lee, Chi-Ying M.; Baer, Donald R.

    2003-03-08

    XPS spectra of a spin-coated film poly(vinyl chloride) (PVC) were collected over a period of 243 minutes at 303 K to determine specimen damage during long exposures to monochromatic Al Ka x-rays. For this PVC film we measured the loss of chlorine as a function of time by rastering a focused 104.6 w 100 um diameter x-ray beam over a 1.4 mm x 0.2 mm area on the sample.

  4. X-ray photoelectron spectroscopy and diffraction investigation of a metal-oxide-semiconductor heterostructure: Pt/Gd2O3/Si(111)

    NASA Astrophysics Data System (ADS)

    Ferrah, D.; El Kazzi, M.; Niu, G.; Botella, C.; Penuelas, J.; Robach, Y.; Louahadj, L.; Bachelet, R.; Largeau, L.; Saint-Girons, G.; Liu, Q.; Vilquin, B.; Grenet, G.

    2015-04-01

    Platinum thin films deposited by physical vapor deposition (PVD) on Gd2O3/Si(111) templates are investigated by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and X-ray photoelectron diffraction (XPD). Both XRD and XPD give clear evidence that Gd2O3 grows (111)-oriented and single-domain on Si(111) with mirror epitaxial relationship viz., [1bar10] Gd2O3(111)//[11bar0] Si(111). On Gd2O3/Si(111), Pt is partially crystallized with (111) orientation. There are two epitaxial domains and a slightly visible (111) fiber texture. The in-plane relationships of these Pt(111) domains with Gd2O3(111) are a direct one: [11bar0] Pt(111)//[11bar0] Gd2O3(111) and a mirror one: [1bar10] Pt(111)//[11bar0] Gd2O3(111). XPS reveals that Pt4f exhibits a metallic behavior even for small amounts of Pt but very small chemical shifts suggest that Pt environment is different at the interface with Gd2O3. These XPS chemical shifts have been correlated with features in XPD azimuth curves, which could be related with the existence of hexagonal α-PtO2(0001)layer.

  5. Structure determination of molecules in an alignment laser field by femtosecond photoelectron diffraction using an X-ray free-electron laser

    PubMed Central

    Minemoto, Shinichirou; Teramoto, Takahiro; Akagi, Hiroshi; Fujikawa, Takashi; Majima, Takuya; Nakajima, Kyo; Niki, Kaori; Owada, Shigeki; Sakai, Hirofumi; Togashi, Tadashi; Tono, Kensuke; Tsuru, Shota; Wada, Ken; Yabashi, Makina; Yoshida, Shintaro; Yagishita, Akira

    2016-01-01

    We have successfully determined the internuclear distance of I2 molecules in an alignment laser field by applying our molecular structure determination methodology to an I 2p X-ray photoelectron diffraction profile observed with femtosecond X-ray free electron laser pulses. Using this methodology, we have found that the internuclear distance of the sample I2 molecules in an alignment Nd:YAG laser field of 6 × 1011 W/cm2 is elongated by from 0.18 to 0.30 Å “in average” relatively to the equilibrium internuclear distance of 2.666 Å. Thus, the present experiment constitutes a critical step towards the goal of femtosecond imaging of chemical reactions and opens a new direction for the study of ultrafast chemical reaction in the gas phase. PMID:27934891

  6. Development of a single-shot CCD-based data acquisition system for time-resolved X-ray photoelectron spectroscopy at an X-ray free-electron laser facility.

    PubMed

    Oura, Masaki; Wagai, Tatsuya; Chainani, Ashish; Miyawaki, Jun; Sato, Hiromi; Matsunami, Masaharu; Eguchi, Ritsuko; Kiss, Takayuki; Yamaguchi, Takashi; Nakatani, Yasuhiro; Togashi, Tadashi; Katayama, Tetsuo; Ogawa, Kanade; Yabashi, Makina; Tanaka, Yoshihito; Kohmura, Yoshiki; Tamasaku, Kenji; Shin, Shik; Ishikawa, Tetsuya

    2014-01-01

    In order to utilize high-brilliance photon sources, such as X-ray free-electron lasers (XFELs), for advanced time-resolved photoelectron spectroscopy (TR-PES), a single-shot CCD-based data acquisition system combined with a high-resolution hemispherical electron energy analyzer has been developed. The system's design enables it to be controlled by an external trigger signal for single-shot pump-probe-type TR-PES. The basic performance of the system is demonstrated with an offline test, followed by online core-level photoelectron and Auger electron spectroscopy in 'single-shot image', 'shot-to-shot image (image-to-image storage or block storage)' and `shot-to-shot sweep' modes at soft X-ray undulator beamline BL17SU of SPring-8. In the offline test the typical repetition rate for image-to-image storage mode has been confirmed to be about 15 Hz using a conventional pulse-generator. The function for correcting the shot-to-shot intensity fluctuations of the exciting photon beam, an important requirement for the TR-PES experiments at FEL sources, has been successfully tested at BL17SU by measuring Au 4f photoelectrons with intentionally controlled photon flux. The system has also been applied to hard X-ray PES (HAXPES) in `ordinary sweep' mode as well as shot-to-shot image mode at the 27 m-long undulator beamline BL19LXU of SPring-8 and also at the SACLA XFEL facility. The XFEL-induced Ti 1s core-level spectrum of La-doped SrTiO3 is reported as a function of incident power density. The Ti 1s core-level spectrum obtained at low power density is consistent with the spectrum obtained using the synchrotron source. At high power densities the Ti 1s core-level spectra show space-charge effects which are analysed using a known mean-field model for ultrafast electron packet propagation. The results successfully confirm the capability of the present data acquisition system for carrying out the core-level HAXPES studies of condensed matter induced by the XFEL.

  7. Dynamic secondary ion mass spectrometry and X-ray photoelectron spectroscopy on artistic bronze and copper artificial patinas

    NASA Astrophysics Data System (ADS)

    Balta, I. Z.; Pederzoli, S.; Iacob, E.; Bersani, M.

    2009-04-01

    To prevent the natural processes of decay and to develop and improve the treatments of conservation and restoration of artistic bronzes meaning statues and sculptures, it is important understanding the patination processes and the knowledge of artificially corroded surfaces. Chemical and physical characterization of artificial patinas obtained on artistic bronzes and coppers by using the 19th century Western traditional patination techniques and recipes by means of SEM-EDS, light microscopy and ATR/FT-IR has been done in previous studies [I.Z. Balta, L. Robbiola, Characterization of artificial black patinas on artistic cast bronze and pure copper by using SEM-EDS and light microscopy, in: Proceedings of the 13th European Microscopy Congress, 22-27 August 2004, Antwerp, Belgium, EMC 2004 CD-Rom Conference Preprints; I.Z. Balta, L. Robbiola, Traditional artificial artistic bronze and copper patinas—an investigation by SEM-EDS and ATR/FT-IR, in: Proceedings of the 8th International Conference on Non Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage, 15-19 May 2005, Lecce, Italy, ART'05 CD-Rom Conference Preprints]. Differences in morphology (structure, thickness, porosity, adherence, compactity, uniformity, homogeneity) and also in composition, on both artistic cast bronze and pure copper patinas, were clearly evidenced. Further in-depth investigation is required to be carried out in order to better understand the patinas mechanisms of formation and the layers kinetics of growth. The elemental and chemical analysis, either on a surface monolayer or in a depth profile, by using the Secondary Ion Mass Spectrometry (SIMS) and X-ray Photoelectron Spectroscopy (XPS) techniques, can provide this kind of information, unique at trace-level sensitivity. SIMS has proved to be a suitable analytical technique for analyzing small amounts of material with high atomic sensitivity (ppm or even ppb) and high

  8. A high pressure x-ray photoelectron spectroscopy experimental method for characterization of solid-liquid interfaces demonstrated with a Li-ion battery system

    SciTech Connect

    Maibach, Julia; Xu, Chao; Gustafsson, Torbjörn; Edström, Kristina; Eriksson, Susanna K.; Åhlund, John; Siegbahn, Hans; Rensmo, Håkan; Hahlin, Maria

    2015-04-15

    We report a methodology for a direct investigation of the solid/liquid interface using high pressure x-ray photoelectron spectroscopy (HPXPS). The technique was demonstrated with an electrochemical system represented by a Li-ion battery using a silicon electrode and a liquid electrolyte of LiClO{sub 4} in propylene carbonate (PC) cycled versus metallic lithium. For the first time the presence of a liquid electrolyte was realized using a transfer procedure where the sample was introduced into a 2 mbar N{sub 2} environment in the analysis chamber without an intermediate ultrahigh vacuum (UHV) step in the load lock. The procedure was characterized in detail concerning lateral drop gradients as well as stability of measurement conditions over time. The X-ray photoelectron spectroscopy (XPS) measurements demonstrate that the solid substrate and the liquid electrolyte can be observed simultaneously. The results show that the solid electrolyte interphase (SEI) composition for the wet electrode is stable within the probing time and generally agrees well with traditional UHV studies. Since the methodology can easily be adjusted to various high pressure photoelectron spectroscopy systems, extending the approach towards operando solid/liquid interface studies using liquid electrolytes seems now feasible.

  9. Assigning Oxidation States to Organic Compounds via Predictions from X-ray Photoelectron Spectroscopy: A Discussion of Approaches and Recommended Improvements

    SciTech Connect

    Gupta, Vipul; Ganegoda, Hasitha; Engelhard, Mark H.; Terry, Jeff H.; Linford, Matthew R.

    2014-02-11

    The traditional assignment of oxidation numbers to organic molecules is problematic. Accordingly, in 1999, Calzaferri proposed a simple and elegant solution that is based on the similar electronegativities of carbon and hydrogen: hydrogen would be assigned an oxidation number of zero when bonded to carbon. Here we show that X-ray photoelectron spectroscopy (XPS), a core electron spectroscopy that is sensitive to oxidation states of elements, confirms his suggestion. In particular, in this work we: (i) list the typical rules for assigning oxidation numbers, (ii) discuss the traditional assignment of oxidation numbers to organic molecules, (iii) review Calzaferri’s solution, (iv) introduce X-ray photoelectron spectroscopy (XPS), (v) show the consistency of Calzaferri’s suggestion with XPS results, (vi) provide supporting examples from the literature, (vii) provide examples from our own research, and (viii) further confirm the Calzaferri suggestion/photoelectron spectroscopy results by discussing two organic well-known reactions. We end by reechoing Calzaferri’s suggestion that the traditional rules for assigning oxidation numbers to organic molecules be modified.

  10. Atomic layer deposition of ultrathin Cu{sub 2}O and subsequent reduction to Cu studied by in situ x-ray photoelectron spectroscopy

    SciTech Connect

    Dhakal, Dileep; Assim, Khaybar; Lang, Heinrich; Bruener, Philipp; Grehl, Thomas; Georgi, Colin; Waechtler, Thomas; Ecke, Ramona; Schulz, Stefan E. Gessner, Thomas

    2016-01-15

    The growth of ultrathin (<5 nm) Ru-doped Cu{sub 2}O films deposited on SiO{sub 2} by atomic layer deposition (ALD) and Cu films by subsequent reduction of the Cu{sub 2}O using HCO{sub 2}H or CO is reported. Ru-doped Cu{sub 2}O has been deposited by a mixture of 16: 99 mol. % of [({sup n}Bu{sub 3}P){sub 2}Cu(acac)] as Cu precursor and 17: 1 mol. % of [Ru(η{sup 5}-C{sub 7}H{sub 11})(η{sup 5}-C{sub 5}H{sub 4}SiMe{sub 3})] as Ru precursor. The catalytic amount of Ru precursor was to support low temperature reduction of Cu{sub 2}O to metallic Cu by formic acid (HCO{sub 2}H) on arbitrary substrate. In situ x-ray photoelectron spectroscopy investigations of the Cu{sub 2}O ALD film indicated nearly 1 at. % of carbon contamination and a phosphorous contamination below the detection limit after sputter cleaning. Systematic investigations of the reduction of Ru-doped Cu{sub 2}O to metallic Cu by HCO{sub 2}H or CO as reducing agents are described. Following the ALD of 3.0 nm Cu{sub 2}O, the ultrathin films are reduced between 100 and 160 °C. The use of HCO{sub 2}H at 110 °C enabled the reduction of around 90% Cu{sub 2}O. HCO{sub 2}H is found to be very effective in the removal of oxygen from Ru-doped Cu{sub 2}O films with 2.5–4.7 nm thickness. In contrast, CO was effective for the removal of oxygen from the Cu{sub 2}O films only below 3.0 nm at 145 °C. Root mean square surface roughness of 0.4 ± 0.1 nm was observed from atomic force microscopy (AFM) investigations after the ALD of Cu{sub 2}O, followed by the subsequent reduction of 3.0 nm Cu{sub 2}O using either HCO{sub 2}H at 110 °C or CO at 145 °C on SiO{sub 2}. Furthermore, ex situ low energy ion scattering and AFM investigations confirmed that the Cu{sub 2}O film after ALD and Cu films after subsequent reduction was continuous on the SiO{sub 2} substrate.

  11. Electronic structure of β-Ga{sub 2}O{sub 3} single crystals investigated by hard X-ray photoelectron spectroscopy

    SciTech Connect

    Li, Guo-Ling; Zhang, Fabi; Guo, Qixin; Cui, Yi-Tao; Oji, Hiroshi; Son, Jin-Young

    2015-07-13

    By combination of hard X-ray photoelectron spectroscopy (HAXPES) and first-principles band structure calculations, the electronic states of β-Ga{sub 2}O{sub 3} were investigated to deepen the understanding of bulk information for this compound. The valence band spectra of HAXPES presented the main contribution from Ga 4sp, which are well represented by photoionization cross section weighted partial density of states. The experimental data complemented with the theoretical study yield a realistic picture of the electronic structure for β-Ga{sub 2}O{sub 3}.

  12. X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd2O2S:Tb3+ phosphor thin films

    NASA Astrophysics Data System (ADS)

    Dolo, J. J.; Swart, H. C.; Terblans, J. J.; Coetsee, E.; Ntwaeaborwa, O. M.; Dejene, B. F.

    2012-05-01

    This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd2O2S:Tb3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd2O2S:Tb3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd2O3 on the degraded and undegraded thin film spots. The presence of the SO2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.

  13. New insights from X-ray photoelectron spectroscopy into the chemistry of covalent enzyme immobilization, with glutamate dehydrogenase (GDH) on silicon dioxide as an example.

    PubMed

    Longo, Luigia; Vasapollo, Giuseppe; Guascito, Maria Rachele; Malitesta, Cosimino

    2006-05-01

    A three-step process for immobilization of glutamate dehydrogenase (GDH) on the surface of silicon dioxide has been studied by X-ray photoelectron spectroscopy (XPS). The enzyme layer was deposited on the silicon dioxide surface after first exposing the surface to 3-aminopropyltriethoxysilane (3-APTS) and reacting the silylated surface with glutaraldehyde (GA). Fine XPS analysis, performed after each step of the chemical procedure, revealed unknown details of the step-by-step construction of the enzyme layer under different experimental conditions.

  14. X-ray photoelectron spectroscopy study of radiofrequency sputtered chromium bromide, molybdenum disilicide, and molybdenum disulfide coatings and their friction properties

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.; Brainard, W. A.

    1977-01-01

    Radiofrequency sputtered coatings of CRB2, MOSI2, and MOS2 were examined by X-ray photoelectron spectroscopy. The effects of sputtering target history, deposition time, RF power level, and substrate bias on film composition were studied. Friction tests were run on RF sputtered surfaces of 440-C steel to correlate XPS data with lubricating properties. Significant deviations from stoichiometry and high oxide levels for all three compounds were related to target outgassing. The effect of biasing on these two factors depended on the compound. Improved stoichiometry correlated well with good friction and wear properties.

  15. Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer

    SciTech Connect

    Weiland, Conan; Browning, Raymond; Karlin, Barry A.; Fischer, Daniel A.; Woicik, Joseph C.

    2013-03-15

    X-ray photoelectron spectroscopy is an established technique for quantitative chemical analysis requiring accurate peak intensity analysis. We present evidence of focus/alignment dependence of relative peak intensities for peaks over a broad kinetic energy range with a hemispherical electron analyzer operated in a position imaging mode. A decrease of over 50% in the Ag 2p{sub 3/2} to Ag 3d ratio is observed in a Ag specimen. No focus/alignment dependence is observed when using an angular imaging mode, necessitating the use of angular mode for quantitative chemical analysis.

  16. Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer.

    PubMed

    Weiland, Conan; Browning, Raymond; Karlin, Barry A; Fischer, Daniel A; Woicik, Joseph C

    2013-03-01

    X-ray photoelectron spectroscopy is an established technique for quantitative chemical analysis requiring accurate peak intensity analysis. We present evidence of focus∕alignment dependence of relative peak intensities for peaks over a broad kinetic energy range with a hemispherical electron analyzer operated in a position imaging mode. A decrease of over 50% in the Ag 2p₃/₂ to Ag 3d ratio is observed in a Ag specimen. No focus∕alignment dependence is observed when using an angular imaging mode, necessitating the use of angular mode for quantitative chemical analysis.

  17. Oxidation and surface segregation of chromium in Fe-Cr alloys studied by Mössbauer and X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Idczak, R.; Idczak, K.; Konieczny, R.

    2014-09-01

    The room temperature 57Fe Mössbauer and XPS spectra were measured for polycrystalline iron-based Fe-Cr alloys. The spectra were collected using three techniques: the transmission Mössbauer spectroscopy (TMS), the conversion electron Mössbauer spectroscopy (CEMS) and the X-ray photoelectron spectroscopy (XPS). The combination of these experimental techniques allows to determine changes in Cr concentration and the presence of oxygen in bulk, in the 300 nm pre-surface layer and on the surface of the studied alloys.

  18. Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy

    SciTech Connect

    Yukawa, R.; Yamamoto, S.; Ogawa, M.; Yamamoto, Sh.; Fujikawa, K.; Hobara, R.; Matsuda, I.; Ozawa, K.; Emori, M.; Sakama, H.; Kitagawa, S.; Daimon, H.

    2014-10-13

    Time-resolved soft X-ray photoelectron spectroscopy (PES) experiments were performed with time scales from picoseconds to nanoseconds to trace relaxation of surface photovoltage on the ZnO(0001) single crystal surface in real time. The band diagram of the surface has been obtained numerically using PES data, showing a depletion layer which extends to 1 μm. Temporal evolution of the photovoltage effect is well explained by a recombination process of a thermionic model, giving the photoexcited carrier lifetime of about 1 ps at the surface under the flat band condition. This lifetime agrees with a temporal range reported by the previous time-resolved optical experiments.

  19. Complementary low energy ion scattering and X-ray photoelectron spectroscopy characterization of polystyrene submitted to N 2/H 2 glow discharge

    NASA Astrophysics Data System (ADS)

    Bonatto, F.; Rovani, S.; Kaufmann, I. R.; Soares, G. V.; Baumvol, I. J. R.; Krug, C.

    2012-02-01

    Low energy ion scattering (LEIS) and X-ray photoelectron spectroscopy (XPS) were used to access the elemental composition and chemical bonding characteristics of polystyrene (PS) surfaces sequentially treated by corona and glow discharge (plasma) processing in N 2/H 2 ambient. The latter has shown activity as suppressor of pathogenic Staphylococcus epidermidis biofilms. LEIS indicated that oxygen from the corona discharge process is progressively replaced by nitrogen at the PS surface. XPS shows C dbnd N and N sbnd C dbnd O chemical groups as significant inhibitors of bacterial adhesion, suggesting application in medical devices.

  20. Fingerprints of the hydrogen bond in the photoemission spectra of croconic acid condensed phase: An x-ray photoelectron spectroscopy and ab-initio study

    SciTech Connect

    Bisti, F.; Stroppa, A.; Picozzi, S.; Ottaviano, L.

    2011-05-07

    The electronic structure of Croconic Acid in the condensed phase has been studied by comparing core level and valence band x-ray photoelectron spectroscopy experiments and first principles density functional theory calculations using the Heyd-Scuseria-Ernzerhof screened hybrid functional and the GW approximation. By exploring the photoemission spectra for different deposition thicknesses, we show how the formation of the hydrogen bond network modifies the O 1s core level lineshape. Moreover, the valence band can be explained only if the intermolecular interactions are taken into account in the theoretical approach.

  1. Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study

    PubMed Central

    Narayanan, Vyshnavi; Bruneel, Els; Hühne, Ruben; van Driessche, Isabel

    2012-01-01

    This work describes various combinations of cleaning methods involved in the preparation of Ni-5% W substrates for the deposition of buffer layers using water-based solvents. The substrate has been studied for its surface properties using X-ray photoelectron spectroscopy (XPS). The contaminants in the substrates have been quantified and the appropriate cleaning method was chosen in terms of contaminants level and showing good surface crystallinity to further consider them for depositing chemical solution-based buffer layers for Y1Ba2Cu3Oy (YBCO) coated conductors.

  2. X-ray photoelectron spectroscopic study of surface chemistry of dibenzyl-disulfide on steel under mild and severe wear conditions

    NASA Technical Reports Server (NTRS)

    Wheeler, D. R.

    1977-01-01

    Wear tests were performed on 304 stainless steel lubricated with pure mineral oil with and without dibenzyl-disulfide. Both mild and severe wear were observed. The type of wear was distinguished by a marked change in wear rate, friction coefficient, and wear scar appearance. The chemical composition of the wear scar surface was examined with X-ray photoelectron spectroscopy in conjunction with argon ion sputter etching. In severe wear scars, a sulfide was formed at the expense of the normal oxide layer. In mild wear scars, there were only superficial sulfur compounds, but there was a substantial increase in the oxide thickness.

  3. Dependence of aluminum-doped zinc oxide work function on surface cleaning method as studied by ultraviolet and X-ray photoelectron spectroscopies

    NASA Astrophysics Data System (ADS)

    Wang, Weiyan; Feng, Quanyu; Jiang, Kemin; Huang, Jinhua; Zhang, Xianpeng; Song, Weijie; Tan, Ruiqin

    2011-02-01

    The dependence of aluminum-doped zinc oxide (AZO) work function on surface treatment, i.e. acetone solvent cleaning and ultraviolet (UV)-ozone cleaning, was studied by ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. Comparing different cleaning methods, UV-ozone treated AZO achieved relative higher work function of 4.26 eV; whereas acetone solvent treated AZO had relative lower work function of 3.94 eV. Two factors, stoichiometry ratio of [OZnAl]/[Zn] + 1.5[Al] and carbon contamination on AZO surface, affected the work function and, moreover, the stoichiometry ratio was supposed to be the controlling factor. It was concluded that AZO with high stoichiometry ratio and reduced carbon concentration possessed high work function.

  4. Polarity of semipolar wurtzite crystals: X-ray photoelectron diffraction from GaN(101⁻1) and GaN(202⁻1) surfaces

    SciTech Connect

    Romanyuk, O. Jiříček, P.; Bartoš, I.; Paskova, T.

    2014-09-14

    Polarity of semipolar GaN(101⁻1) (101⁻1⁻) and GaN(202⁻1) (202⁻1⁻) surfaces was determined with X-ray photoelectron diffraction (XPD) using a standard MgKα source. The photoelectron emission from N 1s core level measured in the a-plane of the crystals shows significant differences for the two crystal orientations within the polar angle range of 80–100° from the (0001) normal. It was demonstrated that XPD polar plots recorded in the a-plane are similar for each polarity of the GaN(101⁻1) and GaN(202⁻1) crystals if referred to (0001) crystal axes. For polarity determinations of all important GaN(h0h⁻l) semipolar surfaces, the above given polar angle range is suitable.

  5. Angle-resolved X-ray photoelectron spectroscopy study of poly(vinylidene fluoride)/poly(N-dodecylacrylamide) Langmuir-Blodgett nanofilms

    NASA Astrophysics Data System (ADS)

    Zhu, Huie; Gao, Yu; Yamamoto, Shunsuke; Miyashita, Tokuji; Mitsuishi, Masaya

    2016-03-01

    Our earlier research prepared ferroelectric poly(vinylidene fluoride) (PVDF) homopolymer monolayers at the air-water interface using amphiphilic poly(N-dodecylacrylamide) (pDDA) nanosheets with Langmuir-Blodgett (LB) technique. However, the miscibility of solvent for PVDF with the water sub-phase in the Langmuir trough makes the film composition unclear in spite of the feeding ratio of \\text{PVDF}:\\text{pDDA} (50:1). In this study, angle-resolved X-ray photoelectron spectroscopy (AR-XPS) was used to investigate the surface chemical composition and the depth profile of the PVDF/pDDA LB nanofilms. The X-ray photoelectron spectroscopy (XPS) spectra confirmed by the detection of fluorine atoms that PVDF molecules were deposited successfully onto the substrate. The constant chemical composition with increasing takeoff angle from 15 to 75° reflects a well-regular layer structure of the PVDF LB nanofilm. The mixing ratio of \\text{PVDF}:\\text{pDDA} is 33:1, which contributes 89.8 wt % PVDF and 10.2 wt % in the PVDF/pDDA LB nanofilms.

  6. X-ray monitoring optical elements

    SciTech Connect

    Stoupin, Stanislav; Shvydko, Yury; Katsoudas, John; Blank, Vladimir D.; Terentyev, Sergey A.

    2016-12-27

    An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.

  7. Layered structure of the near-surface region of oxidized chalcopyrite (CuFeS2): hard X-ray photoelectron spectroscopy, X-ray absorption spectroscopy and DFT+U studies.

    PubMed

    Mikhlin, Yuri; Nasluzov, Vladimir; Romanchenko, Alexander; Tomashevich, Yevgeny; Shor, Alexey; Félix, Roberto

    2017-01-25

    The depletion of oxidized metal sulfide surfaces in metals due to the preferential release of cations is a common, but as yet poorly understood phenomenon. Herein, X-ray photoelectron spectroscopy using excitation energies from 1.25 keV to 6 keV, and Fe K- and S K-edge X-ray absorption near-edge spectra in total electron and partial fluorescence yield modes was employed to study natural chalcopyrite oxidized in air and etched in an acidic ferric sulfate solution. The metal-depleted undersurface formed was found to consist of a thin, 1-4 nm, outer layer containing polysulfide species, a layer with a pronounced deficiency of metals, mainly iron, and an abundant disulfide content but negligible polysulfide content (about 20 nm thick after the chemical etching), and a defective underlayer which extended down to about a hundred nm. DFT+U was used to simulate chalcopyrite with increasing numbers of removed Fe atoms. It was found that the structure with disulfide anion near double Fe vacancies, and the 'defective' structure comprising Cu in the position of Fe and Cu vacancy are most energetically favorable, especially when using a higher Hubbard-type parameter U, and have a large density of states at the Fermi level, whereas polysulfide anions are stable only near the surface. We propose a mechanism explaining the formation of the layered undersurface and 'passivation' of metal sulfides by (i) arrested decomposition of a nearly stoichiometric sulfide surface, and (ii) faster interfacial transfer and solid diffusion of cations towards the surface; (iii) stability limits for specific defect structures, promoting their expansion in depth rather than through compositional changes, excluding surface layers; (iv) decay of surface polysulfide layer yielding elemental sulfur.

  8. X-ray emission and photoelectron spectra of Pr{sub 0.5}Sr{sub 0.5}MnO{sub 3}

    SciTech Connect

    Kurmaev, E.Z.; Korotin, M.A.; Galakhov, V.R.; Finkelstein, L.D.; Zabolotzky, E.I.; Efremova, N.N.; Lobachevskaya, N.I.; Stadler, S.; Ederer, D.L.; Callcott, T.A.; Zhou, L.; Moewes, A.; Bartkowski, S.; Neumann, M.; Matsuno, J.; Mizokawa, T.; Fujimori, A.; Mitchell, J.

    1999-05-01

    The results of measurements of x-ray photoelectron (XPS), x-ray emission (XES), and x-ray absorption spectra and local spin-density approximation band structure (LSDA) calculations of Pr{sub 0.5}Sr{sub 0.5}MnO{sub 3} are presented. The excitation energy dependence of Mn L{sub 2,3} and O K{alpha} x-ray emission spectra of Pr{sub 0.5}Sr{sub 0.5}MnO{sub 3} is measured using tunable synchrotron radiation. The XES measurements yielded no photon energy dependence for the O K{alpha} spectra, but the Mn L{sub 2,3} spectra yielded inelastic scattering losses of 2 and 6 eV, corresponding to features in the structure of the occupied part of the valence band. Comparing XPS and XES measurements with LSDA band-structure calculations, one concludes that the electronic structure of the compound consists mainly of Mn 3d and O 2p states. States of 3d character localized at the Mn site predominate near the top of the valence band (VB). Some differences in the Mn 3d distribution in this part of the XPS valence band and Mn L{sub 3} XES with {ital d} symmetry due to spin-selection rules that govern the Mn L{sub 3} XES. In addition, the Mn 3d states distribution is hybridized with the O 2p part of the VB. Mn L{sub 3} XES spectra were determined relative to the Fermi energy by assuming normal x-ray emission begins from the lowest level of the p{sup 5}d{sup n+1}L intermediate state (which is the Mn 2p ionizatation threshold). From the local spin-density approximation, the orbital character of the Mn 3d electrons can be assigned e{sub g} symmetry at the top of the valence band T{sub 2g} in the central part of the VB, and equal contributions of e{sub g} and t{sub 2g} states at the bottom of the valence band. {copyright} {ital 1999} {ital The American Physical Society}

  9. Electronic structure of nickel porphyrin NiP: Study by X-ray photoelectron and absorption spectroscopy

    NASA Astrophysics Data System (ADS)

    Svirskiy, G. I.; Sergeeva, N. N.; Krasnikov, S. A.; Vinogradov, N. A.; Sergeeva, Yu. N.; Cafolla, A. A.; Preobrajenski, A. B.; Vinogradov, A. S.

    2017-02-01

    Energy distributions and properties of the occupied and empty electronic states for a planar complex of nickel porphyrin NiP are studied by X-ray photoemission and absorption spectroscopy techniques. As a result of the analysis of the experimental spectra of valence photoemission, the nature and energy positions of the highest occupied electronic states were determined: the highest occupied state is formed mostly by atomic states of the porphine ligand; the following two states are associated with 3 d states of the nickel atom. It was found that the lowest empty state is specific and is described by the σ-type b 1 g MO formed by empty Ni3{d_{{x^2} - {y^2}}}-states and occupied 2 p-states of lone electron pairs of nitrogen atoms. This specific nature of the lowest empty state is a consequence of the donor-acceptor chemical bond in NiP.

  10. Electronic structure of the polymer-cathode interface of an organic electroluminescent device investigated using operando hard x-ray photoelectron spectroscopy

    SciTech Connect

    Ikeuchi, J.; Hamamatsu, H.; Miyamoto, T.; Tanaka, S.; Yamashita, Y.; Yoshikawa, H.; Ueda, S.

    2015-08-28

    The electronic structure of a polymer-cathode interface of an operating organic light-emitting diode (OLED) was directly investigated using hard X-ray photoelectron spectroscopy (HAXPES). The potential distribution profile of the light-emitting copolymer layer as a function of the depth under the Al/Ba cathode layer in the OLED depended on the bias voltage. We found that band bending occurred in the copolymer of 9,9-dioctylfluorene (50%) and N-(4-(2-butyl)-phenyl)diphenylamine (F8-PFB) layer near the cathode at 0 V bias, while a linear potential distribution formed in the F8-PFB when a bias voltage was applied to the OLED. Direct observation of the built-in potential and that band bending formed in the F8-PFB layer in the operating OLED suggested that charges moved in the F8-PFB layer before electron injection from the cathode.

  11. Continuous-time photoelectron spectroscopy for monitoring monochromatic soft x-ray photodissociation of CF{sub 3}Cl adsorbed on Si(111)-7x7

    SciTech Connect

    Chou, L.-C.; Chuang, W.-M.; Tsai, W.-C.; Wang, S.-K.; Wu, Y.-H.; Wen, C.-R.

    2007-10-01

    The continuous-time photoelectron spectroscopy was proposed to study the monochromatic soft x-ray photodissociation of CF{sub 3}Cl molecules adsorbed on Si(111)-7x7. Evolution of adsorbed CF{sub 3}Cl was monitored at two photon energies of 240 and 730 eV to deduce the photolysis cross section as a function of energy. Dissociation of adsorbed CF{sub 3}Cl by 240/730 eV photons is attributed to the C-Cl/C-F bond scission following the excitation of Cl(2p)/F(1s) core electron. Observation of time-dependent photodissociation also demonstrates the capability for 'real-time' monitoring of the variations of electronic structure and chemical bonding of adsorbate in bond-selective photochemistry.

  12. X-ray photoelectron spectroscopy and friction studies of nickel-zinc and manganese-zinc ferrites in contact with metals

    NASA Technical Reports Server (NTRS)

    Miyoshi, K.; Buckley, D. H.

    1983-01-01

    X-ray photoelectron spectroscopy analysis and sliding friction experiments were conducted with hot-pressed, polycrystalline Ni-Zn and Mn-Zn ferrites in sliding contact with various transition metals at room temperature in a vacuum of 30 nPa. The results indicate that the coefficients of friction for Ni-Zn and Mn-Zn ferrites in contact with metals are related to the relative chemical activity in these metals: the more active the metal, the higher is the coefficient of friction. The coefficients of friction for the ferrites correlate with the free energy of formation of the lowest metal oxide. The interfacial bond can be regarded as a chemical bond between the metal atoms and the oxygen anions in the ferrite surfaces. The adsorption of oxygen on clean metal and ferrite surfaces increases the coefficients of friction for the Ni-Zn and Mn-Zn ferrite-metal interfaces.

  13. Thermal stability of hydrogenated diamond films in nitrogen ambience studied by reflection electron energy spectroscopy and X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Ren, Bing; Huang, Jian; Yu, Hongze; Yang, Weichuan; Wang, Lin; Pan, Zhangmin; Wang, Linjun

    2016-12-01

    (1 1 0)-oriented diamond films were grown by microwave plasma chemical vapor deposition technique, followed by an optimized hydrogen-plasma treatment process. Thermal stability of hydrogenated diamond films were studied by annealing in nitrogen atmosphere at temperature varied from 400 to 950 °C. Reflection electron energy spectroscopy associated with X-ray photoelectron spectroscopy indicates that approximate at. 50% hydrogen was present at the surface of hydrogenated diamond films, which is close to the theoretical value. Pinning effect in surface Fermi level in hydrogenated diamond films could not be eliminated by annealing in nitrogen until the temperature was exceeded 950 °C. The films underwent hydrogen desorption and subsequent graphitization mainly on the very surface region without significant bulk modification. Besides, hydrogenated diamond films annealed in N2 at 950 °C showed similar hydrophilicity and resistance to that of the oxidized one, indicating rupture of C-H bond on the surface of hydrogenated diamond films.

  14. Elucidating the electronic structure of supported gold nanoparticles and its relevance to catalysis by means of hard X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Reinecke, Benjamin N.; Kuhl, Kendra P.; Ogasawara, Hirohito; Li, Lin; Voss, Johannes; Abild-Pedersen, Frank; Nilsson, Anders; Jaramillo, Thomas F.

    2016-08-01

    We report on the electronic structure of Au (gold) nanoparticles supported onto TiO2 with a goal of elucidating the most important effects that contribute to their high catalytic activity. We synthesize and characterize with high resolution transmission electron microscopy (HRTEM) 3.4, 5.3, and 9.5 nm diameter TiO2-supported Au nanoparticles with nearly spherical shape and measure their valence band using Au 5d subshell sensitive hard X-ray photoelectron spectroscopy (HAXPES) conducted at Spring-8. Based on density functional theory (DFT) calculations of various Au surface structures, we interpret the observed changes in the Au 5d valence band structure as a function of size in terms of an increasing percentage of Au atoms at corners/edges for decreasing particle size. This work elucidates how Au coordination number impacts the electronic structure of Au nanoparticles, ultimately giving rise to their well-known catalytic activity.

  15. X-Ray Photoelectron Spectra of La{sub 0.67}Ca{sub 0.33}MnO{sub 3} Processed by EATPAH Technique

    SciTech Connect

    Mishra, D. K.; Dash, S.; Samantray, S.; Pradhan, S. K.; Das, J.; Roul, B. K.; Varma, S.

    2008-10-23

    La{sub 0.67}Ca{sub 0.33}MnO{sub 3}(LCMO) colossal magnetoresistance (CMR) materials were sintered to highly dense products by an extended arc thermal plasma assisted heating (EATPAH) technique within a short sintering time of 2.5 minutes as compared to conventional long range heating schedule (few hours of time). 2.5 minutes plasma sintered LCMO showed enhanced T{sub c}(272 K), which is closed to T{sub IM}(275 K)[1] as compared to the conventional sintered LCMO sample. Specimens are analyzed by X-ray Photoelectron Spectra (XPS) and electron probe microstructure analysis (EPMA) to get idea on elemental distribution and valence spectra of all the elements present in the specimen. The binding energy of La, Ca and Mn are analogous to the conventional sintered LCMO and to the reference spectra [2].

  16. Understanding the Electronic Structure of IrO2 Using Hard-X-ray Photoelectron Spectroscopy and Density-Functional Theory

    NASA Astrophysics Data System (ADS)

    Kahk, J. M.; Poll, C. G.; Oropeza, F. E.; Ablett, J. M.; Céolin, D.; Rueff, J.-P.; Agrestini, S.; Utsumi, Y.; Tsuei, K. D.; Liao, Y. F.; Borgatti, F.; Panaccione, G.; Regoutz, A.; Egdell, R. G.; Morgan, B. J.; Scanlon, D. O.; Payne, D. J.

    2014-03-01

    The electronic structure of IrO2 has been investigated using hard x-ray photoelectron spectroscopy and density-functional theory. Excellent agreement is observed between theory and experiment. We show that the electronic structure of IrO2 involves crystal field splitting of the iridium 5d orbitals in a distorted octahedral field. The behavior of IrO2 closely follows the theoretical predictions of Goodenough for conductive rutile-structured oxides [J. B. Goodenough, J. Solid State Chem. 3, 490 (1971)]. Strong satellites associated with the core lines are ascribed to final state screening effects. A simple plasmon model for the satellites applicable to many other metallic oxides appears to be not valid for IrO2.

  17. Surface carbonation of synthetic C-S-H samples: A comparison between fresh and aged C-S-H using X-ray photoelectron spectroscopy

    SciTech Connect

    Black, Leon Garbev, Krassimir; Gee, Ian

    2008-06-15

    This paper presents a continuation of studies into silicate anion structure using X-ray photoelectron spectroscopy (XPS). A series of C-S-H samples have been prepared mechanochemically, and then stored under ambient conditions for six months. Storage led to surface carbonation, the extent of which was dependent upon the calcium/silicon ratio of the fresh sample. Carbonation arose through decalcification of the C-S-H, leading to increased silicate polymerisation. The surfaces of the most calcium-rich phases (C/S = 1.33 and 1.50) underwent complete decalcification to yield silica (possibly containing some silanol groups) and calcium carbonate. Carbonation, and hence changes in silicate anion structure, was minimal for the C-S-H phases with C/S = 0.67 and 0.75.

  18. Carbon reaction and diffusion on Ni(111), Ni(100), and Fe(110): Kinetic parameters from x-ray photoelectron spectroscopy and density functional theory analysis

    SciTech Connect

    Wiltner, A.; Linsmeier, Ch.; Jacob, T.

    2008-08-28

    This paper investigates the reactivity of elemental carbon films deposited from the vapor phase with Fe and Ni substrates at room temperature. X-ray photoelectron spectroscopy (XPS) measurements are presented as a method for evaluating kinetic reaction data. Carbon films are deposited on different surface orientations representing geometries from a dense atom packing as in fcc (111) to an open surface structure as in fcc (100). During annealing experiments several reactions are observed (carbon subsurface diffusion, carbide formation, carbide decomposition, and graphite ordering). These reactions and the respective kinetic parameters are analyzed and quantified by XPS measurements performed while annealing at elevated temperatures (620-820 K). The resulting activation barriers for carbon subsurface diffusion are compared with calculated values using the density functional theory. The determined kinetic parameters are used to reproduce the thermal behavior of carbon films on nickel surfaces.

  19. X-Ray photoelectron spectroscopy study of radiofrequency-sputtered titanium, carbide, molybdenum carbide, and titanium boride coatings and their friction properties

    NASA Technical Reports Server (NTRS)

    Brainard, W. A.; Wheeler, D. R.

    1977-01-01

    Radiofrequency sputtered coatings of titanium carbide, molybdenum carbide and titanium boride were tested as wear resistant coatings on stainless steel in a pin on disk apparatus. X-ray photoelectron spectroscopy (XPS) was used to analyze the sputtered films with regard to both bulk and interface composition in order to obtain maximum film performance. Significant improvements in friction behavior were obtained when properly biased films were deposited on deliberately preoxidized substrates. XPS depth profile data showed thick graded interfaces for bias deposited films even when adherence was poor. The addition of 10 percent hydrogen to the sputtering gas produced coatings with thin poorly adherent interfaces. Results suggest that some of the common practices in the field of sputtering may be detrimental to achieving maximum adherence and optimum composition for these refractory compounds.

  20. Biosorption of chromium by alginate extraction products from Sargassum filipendula: investigation of adsorption mechanisms using X-ray photoelectron spectroscopy analysis.

    PubMed

    Bertagnolli, Caroline; Uhart, Arnaud; Dupin, Jean-Charles; da Silva, Meuris Gurgel Carlos; Guibal, Eric; Desbrieres, Jacques

    2014-07-01

    The alginate extraction products from Brazilian brown seaweed Sargassum filipendula were studied for chromium biosorption. Batch experiments were conducted at pH 2 and 3 and 20°C to determine the sorption capacity of this biosorbents for chromium (VI) and (III). The biomass was characterized before and after metal binding by X-ray photoelectron spectroscopy (XPS) in order to determine the mechanisms of chromium biosorption. The residue has a high adsorption capacity, close the value obtained with seaweed and higher than that of alginate for both Cr(III) and Cr(VI). XPS analysis of the biosorbents revealed that carboxyl, amino and sulfonate groups are responsible for the binding of the metal ions. The analysis also indicated that the Cr(VI) bound to the biomass was reduced to Cr(III).

  1. X-Ray Photoelectron Spectroscopy Study of GaAs (001) and InP (001) Cleaning Procedures Prior to Molecular Beam Epitaxy

    NASA Astrophysics Data System (ADS)

    Contour, J. P.; Massies, J.; Saletes, A.

    1985-07-01

    The effect of chemical etching by H2S04/H202/H20 (5/1/1) mixtures and of mechanopolishing by bromine-methanol diluted solution on GaAs (001) and InP (001) substrates for molecular beam epitaxy (MBE) has been studied using X-ray photoelectron spectroscopy (XPS). The final rinse in running deionized water does not produce any passivating oxide layer on the substrate surface. Oxidation observed on GaAs and InP after these cleaning procedures occurs during substrate handling in air. The H2S04/H202/H20 mixture produces arsenic rich surface layers having an atomic ratio As/Ga of 1.15, whereas the bromine-methanol mechanopolishing leads to an arsenic or phosphorus depleted surface with atomic ratios As/Ga=0.7 and P/In=0.65.

  2. X-ray photoelectron spectroscopy study of the mechanism of surface functionalization of metal/carbon nanostructures with sp-elements

    NASA Astrophysics Data System (ADS)

    Shabanova, I. N.; Terebova, N. S.; Sapozhnikov, G. V.; Kodolov, V. I.

    2017-01-01

    The chemical bond of the atoms on the surface of metal/carbon nanostructures functionalized with atoms of sp-elements, such as silicon, phosphorus, sulfur, nitrogen, fluorine, and iodine, and the effect of functionalization on the change in the atomic magnetic moment of the d-metals (Fe, Ni, and Cu) have been studied by X-ray photoelectron spectroscopy. It has been shown that the d-metal atoms form a stable covalent bond with silicon, phosphorus, and sulfur atoms, while the carbon atoms form a stable covalent bond with fluorine, nitrogen, and iodine atoms on the nanostructure surface. It has been found that the functionalization of metal/carbon nanostructures with silicon, sulfur, and phosphorus leads to an increase in the atomic magnetic moment of the d-metal.

  3. Conduction band offset at GeO{sub 2}/Ge interface determined by internal photoemission and charge-corrected x-ray photoelectron spectroscopies

    SciTech Connect

    Zhang, W. F.; Nishimula, T.; Nagashio, K.; Kita, K.; Toriumi, A.

    2013-03-11

    We report a consistent conduction band offset (CBO) at a GeO{sub 2}/Ge interface determined by internal photoemission spectroscopy (IPE) and charge-corrected X-ray photoelectron spectroscopy (XPS). IPE results showed that the CBO value was larger than 1.5 eV irrespective of metal electrode and substrate type variance, while an accurate determination of valence band offset (VBO) by XPS requires a careful correction of differential charging phenomena. The VBO value was determined to be 3.60 {+-} 0.2 eV by XPS after charge correction, thus yielding a CBO (1.60 {+-} 0.2 eV) in excellent agreement with the IPE results. Such a large CBO (>1.5 eV) confirmed here is promising in terms of using GeO{sub 2} as a potential passivation layer for future Ge-based scaled CMOS devices.

  4. Kinetic study of GeO disproportionation into a GeO{sub 2}/Ge system using x-ray photoelectron spectroscopy

    SciTech Connect

    Wang Shengkai; Liu Honggang; Toriumi, Akira

    2012-08-06

    GeO disproportionation into GeO{sub 2} and Ge is studied through x-ray photoelectron spectroscopy. Direct evidence for the reaction 2GeO {yields} GeO{sub 2} + Ge after annealing in ultra-high vacuum is presented. Activation energy for GeO disproportionation is found to be about 0.7 {+-} 0.2 eV through kinetic and thermodynamic calculations. A kinetic model of GeO disproportionation is established by considering oxygen transfer in the GeO network. The relationship between GeO disproportionation and GeO desorption induced by GeO{sub 2}/Ge interfacial reaction is discussed, and the apparent contradiction between GeO desorption via interfacial redox reaction and GeO disproportionation into Ge and GeO{sub 2} is explained by considering the oxygen vacancy.

  5. Structure, Mobility, and Composition of Transition Metal Catalyst Surfaces. High-Pressure Scanning Tunneling Microscopy and Ambient-Pressure X-ray Photoelectron Spectroscopy Studies

    SciTech Connect

    Zhu, Zhongwei

    2013-12-06

    Surface structure, mobility, and composition of transition metal catalysts were studied by high-pressure scanning tunneling microscopy (HP-STM) and ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) at high gas pressures. HP-STM makes it possible to determine the atomic or molecular rearrangement at catalyst surfaces, particularly at the low-coordinated active surface sites. AP-XPS monitors changes in elemental composition and chemical states of catalysts in response to variations in gas environments. Stepped Pt and Cu single crystals, the hexagonally reconstructed Pt(100) single crystal, and Pt-based bimetallic nanoparticles with controlled size, shape and composition, were employed as the model catalysts for experiments in this thesis.

  6. The effect of Sr and Bi on the Si(100) surface oxidation - Auger electron spectroscopy, low energy electron diffraction, and X-ray photoelectron spectroscopy study

    NASA Technical Reports Server (NTRS)

    Fan, W. C.; Mesarwi, A.; Ignatiev, A.

    1990-01-01

    The effect of Sr and Bi on the oxidation of the Si(100) surface has been studied by Auger electron spectroscopy, low electron diffraction, and X-ray photoelectron spectroscopy. A dramatic enhancement, by a factor of 10, of the Si oxidation has been observed for Si(100) with a Sr overlayer. The SR-enhanced Si oxidation has been studied as a function of O2 exposure and Sr coverage. In contrast to the oxidation promotion of Sr on Si, it has been also observed that a Bi overlayer on Si(100) reduced Si oxidation significantly. Sr adsorption on the Si(100) with a Bi overlayer enhances Si oxidation only at Sr coverage of greater than 0.3 ML.

  7. An X-ray photoelectron spectroscopy study of the electrochemical behaviour of iron molybdate thin films in lithium and sodium cells

    NASA Astrophysics Data System (ADS)

    Grissa, R.; Martinez, H.; Pelé, V.; Cotte, S.; Pecquenard, B.; Le Cras, F.

    2017-02-01

    Iron molybdate thin films are studied here as a possible electrode material for future Li and Na microbatteries working in a lower potential range than currently used systems. Monoclinic Fe2(MoO4)3 thin films are successfully deposited using radio frequency (RF) sputtering and an annealing treatment. The electrochemical behaviour of the obtained electrodes against Li and Na is then studied in a coin cell configuration with liquid electrolytes. The redox processes ruling the insertion/deinsertion of Li+ and Na+ are investigated by means of XPS (X-ray Photoelectron Spectroscopy). The results highlight a different behaviour depending on the alkali, with a better redox reversibility for sodium at the end of the first charge. For subsequent cycles however, improved capacity retention is evidenced for cycling versus lithium as compared to sodium which was attributed to the properties of the SEI layer.

  8. Elemental content of enamel and dentin after bleaching of teeth (a comparative study between laser-induced breakdown spectroscopy and x-ray photoelectron spectroscopy)

    SciTech Connect

    Imam, H.; Ahmed, Doaa; Eldakrouri, Ashraf

    2013-06-21

    The elemental content of the superficial and inner enamel as well as that of dentin was analyzed using laser-induced breakdown spectroscopy (LIBS) and x-ray photoelectron spectroscopy (XPS) of bleached and unbleached tooth specimens. It is thus clear from the spectral analysis using both the LIBS and XPS technique that elemental changes (though insignificant within the scopes of this study) of variable intensities do occur on the surface of the enamel and extend deeper to reach dentin. The results of the LIBS revealed a slight reduction in the calcium levels in the bleached compared to the control specimens in all the different bleaching groups and in both enamel and dentin. The good correlation found between the LIBS and XPS results demonstrates the possibility of LIBS technique for detection of minor loss in calcium and phosphorus in enamel and dentin.

  9. X-ray photoelectron spectroscopy of pyrrolidinium-based ionic liquids: cation-anion interactions and a comparison to imidazolium-based analogues.

    PubMed

    Men, Shuang; Lovelock, Kevin R J; Licence, Peter

    2011-09-07

    We investigate seven 1-alkyl-1-methylpyrrolidinium-based ionic liquids, [C(n)C(1)Pyrr][X], using X-ray photoelectron spectroscopy (XPS). The electronic environment for each element is analysed and a robust fitting model is developed for the C 1s region that applies to each of the ionic liquids studied. This model allows accurate charge correction and the determination of reliable and reproducible binding energies for each ionic liquid studied. The electronic interaction between the cation and anion is investigated for ionic liquids with one and also two anions. i.e., mixtures. Comparisons are made to imidazolium-based ionic liquids; in particular, a detailed comparison is made between [C(8)C(1)Pyrr][X] and [C(8)C(1)Im][X](-), where X(¬) is common to both ionic liquids.

  10. Real-time observation of the dry oxidation of the Si (100) surface with ambient pressure x-ray photoelectron spectroscopy

    SciTech Connect

    Enta, Y.; Mun, B.S.; Rossi, M.; Ross Jr, P.N.; Hussain, Zahid; Fadley, C.S.; Lee, K.-S.; Kim, S.-K.

    2007-09-20

    We have applied ambient-pressure x-ray photoelectron spectroscopy with Si 2p chemical shifts to study the real-time dry oxidation of Si(100), using pressures in the range of 0.01-1 Torr and temperatures of 300-530 oC, and examining the oxide thickness range from 0 to ~;;25 Angstrom. The oxidation rate is initially very high (with rates of up to ~;;225 Angstrom/h) and then, after a certain initial thickness of the oxide in the range of 6-22 Angstrom is formed, decreases to a slow state (with rates of ~;;1.5-4.0 Angstrom/h). Neither the rapid nor the slow regime is explained by the standard Deal-Grove model for Si oxidation.

  11. Comparative Study of the Oxidation of NiAl(100) by Molecular Oxygen and Water Vapor Using Ambient-Pressure X-ray Photoelectron Spectroscopy.

    PubMed

    Liu, Qianqian; Qin, Hailang; Boscoboinik, Jorge Anibal; Zhou, Guangwen

    2016-11-08

    The oxidation behavior of NiAl(100) by molecular oxygen and water vapor under a near-ambient pressure of 0.2 Torr is monitored using ambient-pressure X-ray photoelectron spectroscopy. O2 exposure leads to the selective oxidation of Al at temperatures ranging from 40 to 500 °C. By contrast, H2O exposure results in the selective oxidation of Al at 40 and 200 °C, and increasing the oxidation temperature above 300 °C leads to simultaneous formation of both Al and Ni oxides. These results demonstrate that the O2 oxidation forms a nearly stoichiometric Al2O3 structure that provides improved protection to the metallic substrate by barring the outward diffusion of metals. By contrast, the H2O oxidation results in the formation of a defective oxide layer that allows outward diffusion of Ni at elevated temperatures for simultaneous NiO formation.

  12. Adsorption and stability of malonic acid on rutile TiO2 (110), studied by near edge X-ray absorption fine structure and photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Syres, Karen L.; Thomas, Andrew G.; Graham, Darren M.; Spencer, Ben F.; Flavell, Wendy R.; Jackman, Mark J.; Dhanak, Vinod R.

    2014-08-01

    The adsorption of malonic acid on rutile TiO2 (110) has been studied using photoelectron spectroscopy and C K-edge, near edge X-ray fine structure spectroscopy (NEXAFS). Analysis of the O 1s and Ti 2p spectra suggest that the molecule adsorbs dissociatively in a doubly-bidentate adsorption geometry as malonate. The data are unable to distinguish between a chelating bonding mode with the backbone of the molecule lying along the [001] azimuth or a bridging geometry along the direction. Work carried out on a wiggler beamline suggests that the molecule is unstable under irradiation by high-flux synchrotron radiation from this type of insertion device.

  13. Auger electron nanoscale mapping and x-ray photoelectron spectroscopy combined with gas cluster ion beam sputtering to study an organic bulk heterojunction

    SciTech Connect

    Heon Kim, Seong; Heo, Sung; Ihn, Soo-Ghang; Yun, Sungyoung; Hwan Park, Jong; Chung, Yeonji; Lee, Eunha; Park, Gyeongsu; Yun, Dong-Jin

    2014-06-16

    The lateral and vertical distributions of organic p/n bulk heterojunctions for an organic solar cell device are, respectively, investigated using nanometer-scale Auger electron mapping and using X-ray photoelectron spectroscopy (XPS) with Ar gas cluster ion beam (GCIB) sputtering. The concentration of sulfur, present only in the p-type material, is traced to verify the distribution of p-type (donor) and n-type (acceptor) materials in the blended structure. In the vertical direction, a considerable change in atomic sulfur concentration is observed using XPS depth profiling with Ar GCIB sputtering. In addition, Auger electron mapping of sulfur reveals the lateral 2-dimensional distribution of p- and n-type materials. The combination of Auger electron mapping with Ar GCIB sputtering should thereby allow the construction of 3-dimensional distributions of p- and n-type materials in organic photovoltaic cells.

  14. The nature of the water nucleation sites on TiO2(110) surfacesrelvealed by ambient pressure x-ray photoelectron spectroscopy

    SciTech Connect

    Ketteler, Guido; Yamamoto, Susumu; Bluhm, Hendrik; Andersson,Klas; Starr, David E.; Ogletree, D. Frank; Ogasawara, Hirohito; Nilsson,Anders; Salmeron, Miquel

    2007-05-01

    X-ray photoelectron spectroscopy at ambient conditions of pressure (up to 1.5 Torr) and temperature (265K

  15. Auger electron spectroscopy and x-ray photoelectron spectroscopy of the biocorrosion of copper by Gum Arabic, BCS and Pseudomonas atlantica exopolymer

    SciTech Connect

    Jolley, J.G.; Geesey, G.G.; Hankins, M.R.; Wright, R.B.; Wichlacz, P.L.

    1987-01-01

    Thin films (3.4 nm) of copper on germanium substrates were exposed to 10% Gum Arabic aqueous solution, 1% BCS (aqueous and simulated sea water solutions) and 0.5% Pseudomonas atlantica exopolymer (aqueous and simulated sea water solutions). Pre- and post-exposure characterization were done by Auger electron spectroscopy and x-ray photoelectron spectroscopy. Ancillary graphite furnace atomic absorption spectroscopy was used to monitor the removal process of the copper thin film from the germanium substrate. Results indicate that the copper was oxidized by the Gum Arabic and BCS, and some was removed from the Cu/Ge interface by all three polymers and incorporated into the polymer matrix. Thus biocorrosion of copper was exhibited by the Gum Arabic, BCS and Pseudomonas atlantica exopolymer. 14 refs., 4 figs., 3 tabs.

  16. X-ray photoelectron spectroscopy characterization of a nonsuperconducting Y-Ba-Cu-O superconductor-normal-metal-superconductor barrier material

    NASA Technical Reports Server (NTRS)

    Vasquez, R. P.; Hunt, B. D.; Foote, M. C.; Bajuk, L. J.

    1992-01-01

    A film of a novel nonsuperconducting Y-Ba-Cu-O (YBCO) barrier material was grown using conditions similar to those reported by Agostinelli et al. (1991) for forming a cubic semiconducting (c-YBCO) phase, and the material was characterized using X-ray photoelectron spectroscopy (XPS). A comparison of the XPS spectra of this material to those obtained from the orthorhombic and tetragonal phases of YBCO (o-YBCO and t-YBCO, respectively) showed that the barrier material had spectral characteristics different from those of o-YBCO and t-YBCO, particularly in the O 1s region. Features associated with the Cu-O chain and surface-reconstructed Cu-O planes were absent, consistent with expectations for the simple perovskite crystal structure of c-YBCO proposed by Agostinelli et al.

  17. The role of cesium suboxides in low-work-function surface layers studied by X-ray photoelectron spectroscopy - Ag-O-Cs

    NASA Technical Reports Server (NTRS)

    Yang, S.-J.; Bates, C. W., Jr.

    1980-01-01

    The oxidation of cesium on silver substrates has been studied using photoyield measurements and X-ray photoelectron spectroscopy. The occurrence of two O1s peaks in the core-level spectrum at 527.5 and 531.5-eV binding energy for cesium and oxygen exposures giving the optimum photoyield proves that two oxides of cesium exist in high-photoyield surfaces, and not Cs2O alone as previously thought. From the shape and position of the cesium peaks and the Auger parameter, the assignment of the O1s peaks at 527.5- and 531.5-eV binding energies to oxygen in Cs2O and Cs11O3, respectively, can be made. Hence the total cesium-oxygen layer is a mixed phase consisting of Cs2O + Cs11O3, approximately 20-40 A thick.

  18. Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

    SciTech Connect

    Romanyuk, O. Jiříček, P.; Bartoš, I.; Fernández-Garrido, S.; Geelhaar, L.; Brandt, O.; Paskova, T.

    2015-01-12

    We investigate GaN nanowire ensembles spontaneously formed in plasma-assisted molecular beam epitaxy by non-destructive low-energy electron diffraction (LEED) and x-ray photoelectron diffraction (XPD). We show that GaN nanowire ensembles prepared on AlN-buffered 6H-SiC(0001{sup ¯}) substrates with well-defined N polarity exhibit similar LEED intensity-voltage curves and angular distribution of photo-emitted electrons as N-polar free-standing GaN layers. Therefore, as in the case of GaN layers, LEED and XPD are found to be suitable techniques to assess the polarity of GaN nanowire ensembles on a macroscopic scale. The analysis of GaN nanowire ensembles prepared on bare Si(111) allows us to conclude that, on this non-polar substrate, the majority of nanowires is also N-polar.

  19. Band alignment study of lattice-matched In{sub 0.49}Ga{sub 0.51}P and Ge using x-ray photoelectron spectroscopy

    SciTech Connect

    Owen, Man Hon Samuel E-mail: yeo@ieee.org; Zhou, Qian; Gong, Xiao; Yeo, Yee-Chia E-mail: yeo@ieee.org; Zhang, Zheng; Pan, Ji Sheng; Loke, Wan Khai; Wicaksono, Satrio; Yoon, Soon Fatt; Tok, Eng Soon

    2014-09-08

    Lattice-matched In{sub 0.49}Ga{sub 0.51}P was grown on a p-type Ge(100) substrate with a 10° off-cut towards the (111) by low temperature molecular beam epitaxy, and the band-alignment of In{sub 0.49}Ga{sub 0.51}P on Ge substrate was obtained by high resolution x-ray photoelectron spectroscopy. The valence band offset for the InGaP/Ge(100) interface was found to be 0.64 ± 0.12 eV, with a corresponding conduction band offset of 0.60 ± 0.12 eV. The InGaP/Ge interface is found to be of the type I band alignment.

  20. Initial stages of ITO/Si interface formation: In situ x-ray photoelectron spectroscopy measurements upon magnetron sputtering and atomistic modelling using density functional theory

    SciTech Connect

    Løvvik, O. M.; Diplas, S.; Ulyashin, A.; Romanyuk, A.

    2014-02-28

    Initial stages of indium tin oxide (ITO) growth on a polished Si substrate upon magnetron sputtering were studied experimentally using in-situ x-ray photoelectron spectroscopy measurements. The presence of pure indium and tin, as well as Si bonded to oxygen at the ITO/Si interface were observed. The experimental observations were compared with several atomistic models of ITO/Si interfaces. A periodic model of the ITO/Si interface was constructed, giving detailed information about the local environment at the interface. Molecular dynamics based on density functional theory was performed, showing how metal-oxygen bonds are broken on behalf of silicon-oxygen bonds. These theoretical results support and provide an explanation for the present as well as previous ex-situ and in-situ experimental observations pointing to the creation of metallic In and Sn along with the growth of SiO{sub x} at the ITO/Si interface.

  1. Elemental content of enamel and dentin after bleaching of teeth (a comparative study between laser-induced breakdown spectroscopy and x-ray photoelectron spectroscopy)

    NASA Astrophysics Data System (ADS)

    Imam, H.; Ahmed, Doaa; Eldakrouri, Ashraf

    2013-06-01

    The elemental content of the superficial and inner enamel as well as that of dentin was analyzed using laser-induced breakdown spectroscopy (LIBS) and x-ray photoelectron spectroscopy (XPS) of bleached and unbleached tooth specimens. It is thus clear from the spectral analysis using both the LIBS and XPS technique that elemental changes (though insignificant within the scopes of this study) of variable intensities do occur on the surface of the enamel and extend deeper to reach dentin. The results of the LIBS revealed a slight reduction in the calcium levels in the bleached compared to the control specimens in all the different bleaching groups and in both enamel and dentin. The good correlation found between the LIBS and XPS results demonstrates the possibility of LIBS technique for detection of minor loss in calcium and phosphorus in enamel and dentin.

  2. Angle-resolved environmental X-ray photoelectron spectroscopy: A new laboratory setup for photoemission studies at pressures up to 0.4 Torr

    NASA Astrophysics Data System (ADS)

    Mangolini, F.; Åhlund, J.; Wabiszewski, G. E.; Adiga, V. P.; Egberts, P.; Streller, F.; Backlund, K.; Karlsson, P. G.; Wannberg, B.; Carpick, R. W.

    2012-09-01

    The paper presents the development and demonstrates the capabilities of a new laboratory-based environmental X-ray photoelectron spectroscopy system incorporating an electrostatic lens and able to acquire spectra up to 0.4 Torr. The incorporation of a two-dimensional detector provides imaging capabilities and allows the acquisition of angle-resolved data in parallel mode over an angular range of 14° without tilting the sample. The sensitivity and energy resolution of the spectrometer have been investigated by analyzing a standard Ag foil both under high vacuum (10-8 Torr) conditions and at elevated pressures of N2 (0.4 Torr). The possibility of acquiring angle-resolved data at different pressures has been demonstrated by analyzing a silicon/silicon dioxide (Si/SiO2) sample. The collected angle-resolved spectra could be effectively used for the determination of the thickness of the native silicon oxide layer.

  3. A quantitative study of valence electron transfer in the skutterudite compound CoP3 by combining x-ray induced Auger and photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Diplas, S.; Prytz, Ø.; Karlsen, O. B.; Watts, J. F.; Taftø, J.

    2007-06-01

    We use the sum of the ionization and Auger energy, the so-called Auger parameter, measured from the x-ray photoelectron spectrum, to study the valence electron distribution in the skutterudite CoP3. The electron transfer between Co and P was estimated using models relating changes in Auger parameter values to charge transfer. It was found that each P atom gains 0.24 e-, and considering the unit formula CoP3 this is equivalent to a donation of 0.72 e- per Co atom. This is in agreement with a recent electron energy-loss spectroscopy study, which indicates a charge transfer of 0.77 e-/atom from Co to P.

  4. Investigation of chemical distribution in the oxide bulk layer in Ti/HfO{sub 2}/Pt memory devices using x-ray photoelectron spectroscopy

    SciTech Connect

    Jiang, Ran; Du, Xianghao; Han, Zuyin; Sun, Weideng

    2015-04-27

    Resistive switching (RS) of Ti/HfO{sub 2}/Pt memory devices was studied using X-ray photoelectron spectroscopy. Hf{sup 4+} monotonously decreases with depth increasing towards to HfO{sub 2}/Pt interface in low resistance state, while a fluctuation distribution of Hf{sup 4+} is shown in high resistance state (HRS) and in the pristine Ti/HfO{sub 2}/Pt devices (without any SET or RESET process). It is explained by the existence of locally accumulated oxygen vacancies (clusters) in the oxide bulk layer in HRS and pristine states. A dynamic model of RS processes was proposed that the oxygen vacancy clusters dominantly determines the resistivity by the connecting/rupture between the neighbor cluster sites in the bulk.

  5. Investigations on surface chemical analysis using X-ray photoelectron spectroscopy and optical properties of Dy3+-doped LiNa3P2O7 phosphor

    NASA Astrophysics Data System (ADS)

    Munirathnam, K.; Dillip, G. R.; Chaurasia, Shivanand; Joo, S. W.; Deva Prasad Raju, B.; John Sushma, N.

    2016-08-01

    Near white-light emitting LiNa3P2O7:Dy3+ phosphors were prepared by a conventional solid-state reaction method. The orthorhombic crystal structure of the phosphors was confirmed using X-ray diffraction (XRD), and the valence states of the surface elements were determined from the binding energies of Li 1s, O 1s, Na 1s, P 2p, and Dy 3d by X-ray photoelectron spectroscopy (XPS). Attenuated total reflectance (ATR) - Fourier transform infrared (FT-IR) spectroscopy was employed to identify the pyrophosphate groups in the phosphors. Diffuse reflectance spectra (DRS) show the absorption bands of the Dy3+ ions in the host material. Intense blue (481 nm) and yellow (575 nm) emissions were obtained at an excitation wavelength of 351 nm and are attributed to the 4F9/2 → 6H15/2 and 4F9/2 → 6H13/2 transitions of Dy3+ ions, respectively. The combination of these two intense bands generates light emission in the near-white region of the chromaticity diagram.

  6. Chemical state analysis of trace-level alkali metals sorbed in micaceous oxide by total reflection X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Baba, Y.; Shimoyama, I.; Hirao, N.

    2016-10-01

    In order to determine the chemical states of radioactive cesium (137Cs or 134Cs) sorbed in clay minerals, chemical states of cesium as well as the other alkali metals (sodium and rubidium) sorbed in micaceous oxides have been investigated by X-ray photoelectron spectroscopy (XPS). Since the number of atoms in radioactive cesium is extremely small, we specially focused on chemical states of trace-level alkali metals. For this purpose, we have measured XPS under X-ray total reflection (TR) condition. For cesium, it was shown that ultra-trace amount of cesium down to about 100 pg cm-2 can be detected by TR-XPS. This amount corresponds to about 200 Bq of 137Cs (t1/2 = 30.2 y). It was demonstrated that ultra-trace amount of cesium corresponding to radioactive cesium level can be measured by TR-XPS. As to the chemical states, it was found that core-level binding energy in TR-XPS for trace-level cesium shifted to lower-energy side compared with that for thicker layer. A reverse tendency is observed in sodium. Based on charge transfer within a simple point-charge model, it is concluded that chemical bond between alkali metal and micaceous oxide for ultra-thin layer is more polarized that for thick layer.

  7. X-ray photoelectron spectroscopy analysis for the chemical impact of solvent addition rate on electromagnetic shielding effectiveness of HCl-doped polyaniline nanopowders

    NASA Astrophysics Data System (ADS)

    Tantawy, Hesham Ramzy; Kengne, Blaise-Alexis F.; McIlroy, David N.; Nguyen, Tai; Heo, Deukhyoun; Qiang, You; Aston, D. Eric

    2015-11-01

    An in-depth analysis of the chemical functionality in HCl-doped polyaniline (PANI) nanopowders is discussed through interpretations of x-ray photoelectron spectra. The distinctions between three PANI sample types, produced under varied synthesis conditions, are compared on the basis correlations between newly collected electron spectra for chemical analysis (or also x-ray photoelectron spectroscopy) and electromagnetic (EM) shielding effectiveness (SE) within two frequency bands (100-1500 MHz and ˜2-14 GHz). The findings are discussed with reference to previous data analysis of electrical conductivities and Raman and UV-vis spectra analyzed from replicates of the same PANI nanopowders, where only the 8-12 GHz range for SE was tested. They further corroborate previous results for limited-solvent conditions that enhance EM shielding. The three nanopowder types show distinctive differences in polaron, bipolaron, and polar lattice contributions. The collective findings describe the chemical connections between controlling and, most importantly, limiting the available solvent for polymerization with simultaneously doping and how it is that the newly developed solvent-limited approach for HCl-PANI nanopowders provides better shielding than traditionally solvent-rich methods by having more extended and perhaps even faster polaron delocalization than other PANI-based products. The maximum oxidation (50%) and doping (49%) levels obtained in the solvent-free nanopowders also produced the highest SE values of 37.3 ± 3.7 dB (MHz band) and 68.6 ± 4.6 dB (GHz band).

  8. Oxidation and deprotonation of synthetic Fe{sup II}-Fe{sup III} (oxy)hydroxycarbonate Green Rust: An X-ray photoelectron study

    SciTech Connect

    Mullet, M. Guillemin, Y.; Ruby, C.

    2008-01-15

    X-ray photoelectron spectroscopy (XPS) was used to investigate chemical bonding and distribution of iron and oxygen species at the surface of Green Rusts (GRs). GRs with variable composition, i.e. Fe{sup II}{sub 6(1-x)}Fe{sup III}{sub 6x}O{sub 12}H{sub 2(7-3x)} CO{sub 3}.3H{sub 2}O where the Fe{sup III} molar fraction of the positively charged hydroxide sheets, x=[Fe(III)]/[Fe(total)] belongs to [1/3, 1], were synthesised under an inert atmosphere. The broadened Fe(2p{sub 3/2}) spectra were fitted using Gupta and Sen multiplets peaks and additional satellite and surface features. The [Fe(III)]/[Fe(total)] surface atomic ratios closely agree with the x ratios expected from the bulk composition, which gives a high degree of confidence on the validity of the proposed fitting procedure. The valence band spectra are also reported and show dependencies on iron speciation. The O(1s) spectra revealed the presence of O{sup 2-}, OH{sup -} species and adsorbed water. The hydroxyl component decreases with increasing x values, i.e. with the amount of ferric iron, while the oxide component increases. This study provides direct spectroscopic evidence of the deprotonation of hydroxyl groups that occurs simultaneously with the oxidation of ferrous iron within the GR structure. - Graphical abstract: X-ray photoelectron spectroscopy (XPS) is used to investigate chemical bonding and distribution of iron and oxygen species at the surface of Green Rust (GR) compounds. First spectroscopic evidence of the deprotonation of hydroxyls groups occurring simultaneously to the oxidation of Fe(II) into Fe(III) species is provided.

  9. X-ray photoelectron spectroscopy analysis for the chemical impact of solvent addition rate on electromagnetic shielding effectiveness of HCl-doped polyaniline nanopowders

    SciTech Connect

    Tantawy, Hesham Ramzy; Aston, D. Eric; Kengne, Blaise-Alexis F.; McIlroy, David N.; Qiang, You; Nguyen, Tai; Heo, Deukhyoun

    2015-11-07

    An in-depth analysis of the chemical functionality in HCl-doped polyaniline (PANI) nanopowders is discussed through interpretations of x-ray photoelectron spectra. The distinctions between three PANI sample types, produced under varied synthesis conditions, are compared on the basis correlations between newly collected electron spectra for chemical analysis (or also x-ray photoelectron spectroscopy) and electromagnetic (EM) shielding effectiveness (SE) within two frequency bands (100–1500 MHz and ∼2–14 GHz). The findings are discussed with reference to previous data analysis of electrical conductivities and Raman and UV-vis spectra analyzed from replicates of the same PANI nanopowders, where only the 8–12 GHz range for SE was tested. They further corroborate previous results for limited-solvent conditions that enhance EM shielding. The three nanopowder types show distinctive differences in polaron, bipolaron, and polar lattice contributions. The collective findings describe the chemical connections between controlling and, most importantly, limiting the available solvent for polymerization with simultaneously doping and how it is that the newly developed solvent-limited approach for HCl-PANI nanopowders provides better shielding than traditionally solvent-rich methods by having more extended and perhaps even faster polaron delocalization than other PANI-based products. The maximum oxidation (50%) and doping (49%) levels obtained in the solvent-free nanopowders also produced the highest SE values of 37.3 ± 3.7 dB (MHz band) and 68.6 ± 4.6 dB (GHz band)

  10. Correlations Between Variations in Solar EUV and Soft X-Ray Irradiance and Photoelectron Energy Spectra Observed on Mars and Earth

    NASA Technical Reports Server (NTRS)

    Peterson, W. K.; Brain, D. A.; Mitchell, D. L.; Bailey, S. M.; Chamberlin, P. C.

    2013-01-01

    Solar extreme ultraviolet (EUV; 10-120 nm) and soft X-ray (XUV; 0-10 nm) radiation are major heat sources for the Mars thermosphere as well as the primary source of ionization that creates the ionosphere. In investigations of Mars thermospheric chemistry and dynamics, solar irradiance models are used to account for variations in this radiation. Because of limited proxies, irradiance models do a poor job of tracking the significant variations in irradiance intensity in the EUV and XUV ranges over solar rotation time scales when the Mars-Sun-Earth angle is large. Recent results from Earth observations show that variations in photoelectron energy spectra are useful monitors of EUV and XUV irradiance variability. Here we investigate photoelectron energy spectra observed by the Mars Global Surveyor (MGS) Electron Reflectometer (ER) and the FAST satellite during the interval in 2005 when Earth, Mars, and the Sun were aligned. The Earth photoelectron data in selected bands correlate well with calculations based on 1 nm resolution observations above 27 nm supplemented by broadband observations and a solar model in the 0-27 nm range. At Mars, we find that instrumental and orbital limitations to the identifications of photoelectron energy spectra in MGS/ER data preclude their use as a monitor of solar EUV and XUV variability. However, observations with higher temporal and energy resolution obtained at lower altitudes on Mars might allow the separation of the solar wind and ionospheric components of electron energy spectra so that they could be used as reliable monitors of variations in solar EUV and XUV irradiance than the time shifted, Earth-based, F(10.7) index currently used.

  11. Correlations between variations in solar EUV and soft X-ray irradiance and photoelectron energy spectra observed on Mars and Earth

    NASA Astrophysics Data System (ADS)

    Peterson, W. K.; Brain, D. A.; Mitchell, D. L.; Bailey, S. M.; Chamberlin, P. C.

    2013-11-01

    extreme ultraviolet (EUV; 10-120 nm) and soft X-ray (XUV; 0-10 nm) radiation are major heat sources for the Mars thermosphere as well as the primary source of ionization that creates the ionosphere. In investigations of Mars thermospheric chemistry and dynamics, solar irradiance models are used to account for variations in this radiation. Because of limited proxies, irradiance models do a poor job of tracking the significant variations in irradiance intensity in the EUV and XUV ranges over solar rotation time scales when the Mars-Sun-Earth angle is large. Recent results from Earth observations show that variations in photoelectron energy spectra are useful monitors of EUV and XUV irradiance variability. Here we investigate photoelectron energy spectra observed by the Mars Global Surveyor (MGS) Electron Reflectometer (ER) and the FAST satellite during the interval in 2005 when Earth, Mars, and the Sun were aligned. The Earth photoelectron data in selected bands correlate well with calculations based on 1 nm resolution observations above 27 nm supplemented by broadband observations and a solar model in the 0-27 nm range. At Mars, we find that instrumental and orbital limitations to the identifications of photoelectron energy spectra in MGS/ER data preclude their use as a monitor of solar EUV and XUV variability. However, observations with higher temporal and energy resolution obtained at lower altitudes on Mars might allow the separation of the solar wind and ionospheric components of electron energy spectra so that they could be used as reliable monitors of variations in solar EUV and XUV irradiance than the time shifted, Earth-based, F10.7 index currently used.

  12. Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

    NASA Astrophysics Data System (ADS)

    Barrett, N.; Gottlob, D. M.; Mathieu, C.; Lubin, C.; Passicousset, J.; Renault, O.; Martinez, E.

    2016-05-01

    Significant progress in the understanding of surfaces and interfaces of materials for new technologies requires operando studies, i.e., measurement of chemical, electronic, and magnetic properties under external stimulus (such as mechanical strain, optical illumination, or electric fields) applied in situ in order to approach real operating conditions. Electron microscopy attracts much interest, thanks to its ability to determine semiconductor doping at various scales in devices. Spectroscopic photoelectron emission microscopy (PEEM) is particularly powerful since it combines high spatial and energy resolution, allowing a comprehensive analysis of local work function, chemistry, and electronic structure using secondary, core level, and valence band electrons, respectively. Here we present the first operando spectroscopic PEEM study of a planar Si p-n junction under forward and reverse bias. The method can be used to characterize a vast range of materials at near device scales such as resistive oxides, conducting bridge memories and domain wall arrays in ferroelectrics photovoltaic devices.

  13. Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions.

    PubMed

    Barrett, N; Gottlob, D M; Mathieu, C; Lubin, C; Passicousset, J; Renault, O; Martinez, E

    2016-05-01

    Significant progress in the understanding of surfaces and interfaces of materials for new technologies requires operando studies, i.e., measurement of chemical, electronic, and magnetic properties under external stimulus (such as mechanical strain, optical illumination, or electric fields) applied in situ in order to approach real operating conditions. Electron microscopy attracts much interest, thanks to its ability to determine semiconductor doping at various scales in devices. Spectroscopic photoelectron emission microscopy (PEEM) is particularly powerful since it combines high spatial and energy resolution, allowing a comprehensive analysis of local work function, chemistry, and electronic structure using secondary, core level, and valence band electrons, respectively. Here we present the first operando spectroscopic PEEM study of a planar Si p-n junction under forward and reverse bias. The method can be used to characterize a vast range of materials at near device scales such as resistive oxides, conducting bridge memories and domain wall arrays in ferroelectrics photovoltaic devices.

  14. Surface and bulk electronic structures of heavily Mg-doped InN epilayer by hard X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Imura, Masataka; Tsuda, Shunsuke; Nagata, Takahiro; Banal, Ryan G.; Yoshikawa, Hideki; Yang, AnLi; Yamashita, Yoshiyuki; Kobayashi, Keisuke; Koide, Yasuo; Yamaguchi, Tomohiro; Kaneko, Masamitsu; Uematsu, Nao; Wang, Ke; Araki, Tsutomu; Nanishi, Yasushi

    2017-03-01

    To evaluate the polarity, energy band diagram, and oxygen (O) distribution of a heavily Mg-doped InN (InN:Mg+) epilayer with a Mg concentration of 1.0 ± 0.5 × 1020 cm-3, the core-level and valence band (VB) photoelectron spectra are investigated by angle-resolved soft and hard X-ray photoelectron spectroscopies. The InN:Mg+ epilayers are grown by radio-frequency plasma-assisted molecular beam epitaxy. In this doping level, the polarity inversion from In-polar to N-polar occurs with the increase in the Mg flow rate under the same growth conditions, and the VB spectrum clearly indicates the direction of polarity of InN:Mg+, which is N-polar. The energy band diagram is considered to exhibit a two-step downward bending structure due to the coexistence of the n+ surface electron accumulation layer and heavily Mg-doped p+ layer formed in the bulk. The O concentration rapidly increases until ˜4 nm with respect to the surface, which is deduced to be one of the reasons of the formation of the anomalous two-step energy band profile.

  15. Sample-morphology effects on x-ray photoelectron peak intensities. III. Simulated spectra of model core–shell nanoparticles

    SciTech Connect

    Powell, Cedric J.; Chudzicki, Maksymilian; Werner, Wolfgang S. M.; Smekal, Werner

    2015-09-15

    The National Institute of Standards and Technology database for the simulation of electron spectra for surface analysis has been used to simulate Cu 2p photoelectron spectra for four types of spherical copper–gold nanoparticles (NPs). These simulations were made to extend the work of Tougaard [J. Vac. Sci. Technol. A 14, 1415 (1996)] and of Powell et al. [J. Vac. Sci. Technol. A 31, 021402 (2013)] who performed similar simulations for four types of planar copper–gold films. The Cu 2p spectra for the NPs were compared and contrasted with analogous results for the planar films and the effects of elastic scattering were investigated. The new simulations were made for a monolayer of three types of Cu/Au core–shell NPs on a Si substrate: (1) an Au shell of variable thickness on a Cu core with diameters of 0.5, 1.0, 2.0, 5.0, and 10.0 nm; (2) a Cu shell of variable thickness on an Au core with diameters of 0.5, 1.0, 2.0, 5.0, and 10.0 nm; and (3) an Au shell of variable thickness on a 1 nm Cu shell on an Au core with diameters of 0.5, 1.0, 2.0, 5.0, and 10.0 nm. For these three morphologies, the outer-shell thickness was varied until the Cu 2p{sub 3/2} peak intensity was the same (within 2%) as that found in our previous work with planar Cu/Au morphologies. The authors also performed similar simulations for a monolayer of spherical NPs consisting of a CuAu{sub x} alloy (also on a Si substrate) with diameters of 0.5, 1.0, 2.0, 5.0, and 10.0 nm. In the latter simulations, the relative Au concentration (x) was varied to give the same Cu 2p{sub 3/2} peak intensity (within 2%) as that found previously. For each morphology, the authors performed simulations with elastic scattering switched on and off. The authors found that elastic-scattering effects were generally strong for the Cu-core/Au-shell and weak for the Au-core/Cu-shell NPs; intermediate elastic-scattering effects were found for the Au-core/Cu-shell/Au-shell NPs. The shell thicknesses required to give

  16. Toward new techniques to measure heterogeneous oxidation of aerosol: Electrodynamic Balance-Mass Spectrometry (EDB-MS) and Aerosol X-ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Jacobs, M. I.; Heine, N.; Xu, B.; Davies, J. F.; Kirk, B. B.; Kostko, O.; Alayoglu, S.; Wilson, K. R.; Ahmed, M.

    2015-12-01

    The chemical composition and physical properties of aerosol can be changed via heterogeneous oxidation with the OH radical. However, the physical state of the aerosol influences the kinetics of this reaction; liquid particles with a high diffusion coefficient are expected to be well mixed and homogenously oxidized, while oxidation of solid, diffusion-limited aerosol is expected to occur primarily on the surface, creating steep chemical gradients within the particle. We are working to develop several new techniques to study the heterogeneous oxidation of different types of aerosol. We are developing a "modular" electrodynamic balance (EDB) that will enable us to study heterogeneous oxidation at aqueous interfaces using a mass-spectrometer (and potentially other detection techniques). Using a direct analysis in real time (DART) interface, preliminary droplet train measurements have demonstrated single-droplet mass spectrometry to be possible. With long reaction times in our EDB, we will be able to study heterogeneous oxidation of a wide variety of organic species in aqueous droplets. Additionally, we are working to use aerosol photoemission and velocity map imaging (VMI) to study the surface of aerosol particles as they undergo heterogeneous oxidation. With VMI, we're able to collect electrons with a 4π collection efficiency over conventional electron energy analyzers. Preliminary results looking at the ozonolysis of squalene using ultraviolet photoelectron spectroscopy (UPS) show that heterogeneous oxidation kinetic data can be extracted from photoelectron spectra. By moving to X-ray photoemission spectroscopy (XPS), we will determine elemental and chemical composition of the aerosol surface. Thus, aerosol XPS will provide information on the steep chemical gradients that form as diffusion-limited aerosol undergo heterogeneous oxidation.

  17. Measurement of valence-band offset at native oxide/BaSi{sub 2} interfaces by hard x-ray photoelectron spectroscopy

    SciTech Connect

    Takabe, Ryota; Du, Weijie; Takeuchi, Hiroki; Toko, Kaoru; Ito, Keita; Ueda, Shigenori; Kimura, Akio; Suemasu, Takashi

    2016-01-14

    Undoped n-type BaSi{sub 2} films were grown on Si(111) by molecular beam epitaxy, and the valence band (VB) offset at the interface between the BaSi{sub 2} and its native oxide was measured by hard x-ray photoelectron spectroscopy (HAXPES) at room temperature. HAXPES enabled us to investigate the electronic states of the buried BaSi{sub 2} layer non-destructively thanks to its large analysis depth. We performed the depth-analysis by varying the take-off angle (TOA) of photoelectrons as 15°, 30°, and 90° with respect to the sample surface and succeeded to obtain the VB spectra of the BaSi{sub 2} and the native oxide separately. The VB maximum was located at −1.0 eV from the Fermi energy for the BaSi{sub 2} and −4.9 eV for the native oxide. We found that the band bending did not occur near the native oxide/BaSi{sub 2} interface. This result was clarified by the fact that the core-level emission peaks did not shift regardless of TOA (i.e., analysis depth). Thus, the barrier height of the native oxide for the minority-carriers in the undoped n-BaSi{sub 2} (holes) was determined to be 3.9 eV. No band bending in the BaSi{sub 2} close to the interface also suggests that the large minority-carrier lifetime in undoped n-BaSi{sub 2} films capped with native oxide is attributed not to the band bending in the BaSi{sub 2}, which pushes away photogenerated minority carriers from the defective surface region, but to the decrease of defective states by the native oxide.

  18. Effects of nitrogen substitution in amorphous carbon films on electronic structure and surface reactivity studied with x-ray and ultra-violet photoelectron spectroscopies

    NASA Astrophysics Data System (ADS)

    Murata, Yuma; Nakayama, Rempei; Ichihara, Fumihiko; Ono, Hiroshi; Choo, Cheow-Keong; Tanaka, Katsumi

    2017-03-01

    We investigated the effects of incorporating a low percentage of nitrogen on the local and the electronic structures of amorphous carbon (a-C) using X-ray photoelectron spectroscopy and ultra-violet photoelectron spectroscopy (UPS). Nitrogen-doped amorphous carbon films (a-CNx) with varying nitrogen contents were prepared by a thermal decomposition method using a mixture of CH4 + NH3 under atmosphere. A slight shift of the C 1s core-level spectrum toward the higher binding energy side was detected in a-CNx as a function of nitrogen content, whereas a shift of the Fermi level (EF) cannot be confirmed from the UPS results. This was interpreted as a chemical shift between carbon and nitrogen atoms rather than as a shift of the EF. The C 1s peak shifts can be explained by the presence of two kinds of C-N local structures and the charge transferred bulk C-C components by nitrogen atoms. The two kinds of deconvoluted C 1s components could be well correlated with the two N 1s components. Two localized states were detected below the EF in UPS spectra of a-CNx, which could be assigned to defect bands. These defects played a significant role in the surface reactivity, and were stabilized in a-CNx. The adsorption and reaction of NO were carried out on a-CNx as well as a-C films. It was found that both defect sites and O2- species were responsible on a-C, while O2- species were selectively active for NO adsorption on a-CNx. We concluded that nitrogen doping reduces defect density to stabilize the surface of a-C, while at the same time inducing the selective adsorption capability of NO.

  19. Final-state effect on x-ray photoelectron spectrum of nominally d1 and n -doped d0 transition-metal oxides

    NASA Astrophysics Data System (ADS)

    Lin, Chungwei; Posadas, Agham; Hadamek, Tobias; Demkov, Alexander A.

    2015-07-01

    We investigate the x-ray photoelectron spectroscopy (XPS) of nominally d1 and n -doped d0 transition-metal oxides including NbO2,SrVO3, and LaTiO3 (nominally d1), as well as n -doped SrTiO3 (nominally d0). In the case of single phase d1 oxides, we find that the XPS spectra (specifically photoelectrons from Nb 3 d , V 2 p , Ti 2 p core levels) all display at least two, and sometimes three distinct components, which can be consistently identified as d0,d1, and d2 oxidation states (with decreasing order in binding energy). Electron doping increases the d2 component but decreases the d0 component, whereas hole doping reverses this trend; a single d1 peak is never observed, and the d0 peak is always present even in phase-pure samples. In the case of n -doped SrTiO3, the d1 component appears as a weak shoulder with respect to the main d0 peak. We argue that these multiple peaks should be understood as being due to the final-state effect and are intrinsic to the materials. Their presence does not necessarily imply the existence of spatially localized ions of different oxidation states nor of separate phases. A simple model is provided to illustrate this interpretation, and several experiments are discussed accordingly. The key parameter to determine the relative importance between the initial-state and final-state effects is also pointed out.

  20. Band bending at the heterointerface of GaAs/InAs core/shell nanowires monitored by synchrotron X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Khanbabaee, B.; Bussone, G.; Knutsson, J. V.; Geijselaers, I.; Pryor, C. E.; Rieger, T.; Demarina, N.; Grützmacher, D.; Lepsa, M. I.; Timm, R.; Pietsch, U.

    2016-10-01

    Unique electronic properties of semiconductor heterostructured nanowires make them useful for future nano-electronic devices. Here, we present a study of the band bending effect at the heterointerface of GaAs/InAs core/shell nanowires by means of synchrotron based X-ray photoelectron spectroscopy. Different Ga, In, and As core-levels of the nanowire constituents have been monitored prior to and after cleaning from native oxides. The cleaning process mainly affected the As-oxides and was accompanied by an energy shift of the core-level spectra towards lower binding energy, suggesting that the As-oxides turn the nanowire surfaces to n-type. After cleaning, both As and Ga core-levels revealed an energy shift of about -0.3 eV for core/shell compared to core reference nanowires. With respect to depth dependence and in agreement with calculated strain distribution and electron quantum confinement, the observed energy shift is interpreted by band bending of core-levels at the heterointerface between the GaAs nanowire core and the InAs shell.

  1. Band offset of Al1‑ x Si x O y mixed oxide on GaN evaluated by hard X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Ito, Kenji; Kikuta, Daigo; Narita, Tetsuo; Kataoka, Keita; Isomura, Noritake; Kitazumi, Kousuke; Mori, Tomohiko

    2017-04-01

    An Al1‑ x Si x O y mixed oxide has been deposited on GaN by plasma-enhanced atomic layer deposition. The band diagrams between the mixed oxide and GaN for various Si atom fraction x values are determined by hard X-ray photoelectron spectroscopy for the first time. The band gap of the mixed oxide increases with increasing x. This dependence has a large bowing parameter of 1.5 eV. We have successfully obtained conduction band offset (ΔE C) and valence band offset (ΔE V) as a function of x: ΔE C (eV) = 1.6 + 0.4x + 1.2x 2 and ΔE V (eV) = 1.7 + 0.34x + 0.36x 2. These relationships enable us to design GaN metal–oxide–semiconductor devices using the Al1‑ x Si x O y mixed oxide.

  2. Recycling of CO2: Probing the Chemical State of the Ni(111) Surface during the Methanation Reaction with Ambient-Pressure X-Ray Photoelectron Spectroscopy.

    PubMed

    Heine, Christian; Lechner, Barbara A J; Bluhm, Hendrik; Salmeron, Miquel

    2016-10-12

    Using ambient-pressure X-ray photoelectron spectroscopy (AP-XPS), we studied the adsorption and reactions of CO2 and CO2 + H2 on the Ni(111) surface to identify the surface chemical state and the nature of the adsorbed species during the methanation reaction. In 200 mTorr CO2, we found that NiO is formed from CO2 dissociation into CO and atomic oxygen. Additionally, carbonate (CO3(2-)) is present on the surface from further reaction of CO2 with NiO. The addition of H2 into the reaction environment leads to reduction of NiO and the disappearance of CO3(2-). At temperatures >160 °C, CO adsorbed on hollow sites, and atomic carbon and OH species are present on the surface. We conclude that the methanation reaction proceeds via dissociation of CO2, followed by reduction of CO to atomic carbon and its hydrogenation to methane.

  3. Temperature effects on Li4Ti5O12 electrode/electrolyte interfaces at the first cycle: A X-ray Photoelectron Spectroscopy and Scanning Auger Microscopy study

    NASA Astrophysics Data System (ADS)

    Gieu, J.-B.; Courrèges, C.; El Ouatani, L.; Tessier, C.; Martinez, H.

    2016-06-01

    Li4Ti5O12-based negative electrodes for Lithium-ion batteries are of interest because of the high reversibility of Li+ insertion/extraction. In this study, the surface of cycled electrodes is analysed by X-ray Photoelectron Spectroscopy (XPS) and Scanning Auger Microscopy (SAM) to investigate the effects of cycling temperature (room temperature, 60 °C and 85 °C) upon the solid electrolyte interphase (SEI) formation, which plays a major role in batteries electrochemical performances. Half-cells, with a vinylene carbonate containing electrolyte, are galvanostatically cycled at different steps of the first cycle: the mid-plateau during the first discharge, the end of the first discharge at 1.2 V and the end of the first charge at 2.0 V. XPS analysis evidences that higher temperatures promote the formation of a thicker SEI, which can explain the increase of the irreversible capacity with temperature. SAM mappings (allowing high spatial resolution ∼10-100 nm) evidence that this SEI homogeneously covers the electrode surface, regardless of the cycling temperature. During charge, the SEI is partially dissolved at room temperature, more slightly at 60 °C whereas at 85 °C, no clear evidence of layer thinning is observed. The SEI chemical composition is also investigated and reveals a majority of organic species and an increasing proportion of LiF with the temperature.

  4. Many-body effects in the 4f x-ray photoelectron spectroscopy of the U5+ and U4+ free ions

    NASA Astrophysics Data System (ADS)

    Ilton, Eugene S.; Bagus, Paul S.

    2005-05-01

    A strictly ab initio many-electron theory was used to calculate the 4f x-ray photoelectron spectroscopy (XPS) of the free U5+ and U4+ ions. The calculations, based on relativistic Dirac-Fock self-consistent field (DF-SCF) and Dirac configuration interaction (DCI) wave functions (WF’s), indicate that the atomic spectra have a considerable multiplet structure. However, the multiplet splitting, which is mainly manifest as a broadening of the 4f5/2 and 4f7/2 lines, is not as strong as for the first-row transition metals. As expected, the U4+ primary peaks are broader and have more associated satellite structure than does U5+ . A comparison of a synthetic spectrum for U4+ with the observed XPS of UO2 indicates that interatomic, solid-state, effects may decrease the multiplet and spin-orbital splitting, relative to the free ion. Notably, the 7eV satellite characteristic of UO2 is absent from the calculated XPS of U4+ .

  5. Atomic-scale structure of the fivefold surface of an AlPdMn quasicrystal: A quantitative x-ray photoelectron diffraction analysis

    NASA Astrophysics Data System (ADS)

    Zheng, Jin-Cheng; Huan, C. H.; Wee, A. T.; van Hove, M. A.; Fadley, C. S.; Shi, F. J.; Rotenberg, E.; Barman, S. R.; Paggel, J. J.; Horn, K.; Ebert, Ph.; Urban, K.

    2004-04-01

    The atomic-scale structure of the fivefold symmetric surface of an AlPdMn quasicrystal is investigated quantitatively by comparing x-ray photoelectron diffraction simulations to experiment. The observed fivefold symmetry of the diffraction patterns indicates that the surface is quasicrystalline with no hint of a reconstruction from the bulk structure. In analyzing the experimental data, many possible bulk terminations have been tested. Those few that fit best to the data have in common that they contain an Al-rich surface layer followed by a dense mixed Al/Pd/Mn layer. These best terminations, while not identical to each other, are suggested to form terraces coexisting on a real surface. Structural relaxations of the quasicrystal surface are also analyzed: mixing several best-fit terminations gives average best-fit interlayer spacing changes of Δd12=-0.057 Å and Δd24=+0.159 Å. These results are in good agreement with a prior structure determination by low-energy electron diffraction on a sample that was prepared in a different manner.

  6. Composition depth profiles of Bi 3.15Nd 0.85Ti 3O 12 thin films studied by X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Zhang, Z. H.; Zhong, X. L.; Liao, H.; Wang, F.; Wang, J. B.; Zhou, Y. C.

    2011-06-01

    In the present work, X-ray photoelectron spectroscopy (XPS) was used to investigate the composition depth profiles of Bi 3.15Nd 0.85Ti 3O 12 (BNT) ferroelectric thin film, which was prepared on Pt(1 1 1)/Ti/SiO 2/Si(1 0 0) substrates by chemical solution deposition (CSD). It is shown that there are three distinct regions formed in BNT film, which are surface layer, bulk film and interface layer. The surface of film is found to consist of one outermost Bi-rich region. High resolution spectra of the O 1 s peak in the surface can be decomposed into two components of metallic oxide oxygen and surface adsorbed oxygen. The distribution of component elements is nearly uniform within the bulk film. In the bulk film, high resolution XPS spectra of O 1 s, Bi 4 f, Nd 3 d, Ti 2 p are in agreement with the element chemical states of the BNT system. The interfacial layer is formed through the interdiffusion between the BNT film and Pt electrode. In addition, the Ar +-ion sputtering changes lots of Bi 3+ ions into Bi 0 due to weak Bi-O bond and high etching energy.

  7. O impurity chemistry in CdS thin-films grown by chemical bath deposition: An investigation with x-ray photoelectron spectroscopy

    SciTech Connect

    Niles, D.W.; Herdt, G.; Al-Jassim, M.

    1997-02-01

    We used x-ray photoelectron spectroscopy to investigate the chemistry of O impurity atoms in CdS thin-films grown for photovoltaic purposes by chemical-bath deposition (CBD). We compared the Cd 3d photoline, O 1s photoline, Cd MNN Auger line, and O KLL Auger line taken from a CBD CdS thin-film, CdS single-crystal reference, Cd metal reference, CdO reference, and Cd(OH){sub 2} reference. This comparison showed that the O present in thin-film CBD CdS is a manifestation of H{sub 2}O incorporated into the film during the CBD growth. Ar{sup +} ion sputtering{emdash}a technique frequently used in thin-film analyses{emdash}preferentially removed S from the CBD CdS thin-film and created CdS{sub 1{minus}x}O{sub x} (x{approximately}0.04) in the surface region from the incorporated O impurity. {copyright} {ital 1997 American Institute of Physics.}

  8. An x-ray photoelectron spectroscopy investigation of O impurity chemistry in CdS thin films grown by chemical bath deposition

    SciTech Connect

    Niles, D.W.; Herdt, G.; Al-Jassim, M.

    1997-02-01

    We used x-ray photoelectron spectroscopy to investigate the chemistry of O impurity atoms in CdS thin films grown for photovoltaic purposes by chemical-bath deposition (CBD). We compared the Cd 3d photoline, O 1s photoline, Cd MNN Auger line, and O KLL Auger line taken from a CBD CdS thin film, CdS single-crystal reference, Cd metal reference, CdO reference, and Cd(OH){sub 2} reference. This comparison showed that the O present in thin-film CBD CdS is a manifestation of H{sub 2}O incorporated into the film during the CBD growth. Ar{sup +} ion sputtering, a technique frequently used in thin-film analyses, preferentially removed S from the CBD CdS thin film and created CdS{sub 1{minus}x}O{sub x} ({ital x}{approximately}0.04) in the surface region from the incorporated O impurity. {copyright} {ital 1997 American Institute of Physics.}

  9. Cation profiling of passive films on stainless steel formed in sulphuric and acetic acid by deconvolution of angle-resolved X-ray photoelectron spectra

    NASA Astrophysics Data System (ADS)

    Högström, Jonas; Fredriksson, Wendy; Edstrom, Kristina; Björefors, Fredrik; Nyholm, Leif; Olsson, Claes-Olof A.

    2013-11-01

    An approach for determining depth gradients of metal-ion concentrations in passive films on stainless steel using angle-resolved X-ray photoelectron spectroscopy (ARXPS) is described. The iterative method, which is based on analyses of the oxidised metal peaks, provides increased precision and hence allows faster ARXPS measurements to be carried out. The method was used to determine the concentration depth profiles for molybdenum, iron and chromium in passive films on 316L/EN 1.4432 stainless steel samples oxidised in 0.5 M H2SO4 and acetic acid diluted with 0.02 M Na2B4O7 · 10H2O and 1 M H2O, respectively. The molybdenum concentration in the film is pin-pointed to the oxide/metal interface and the films also contained an iron-ion-enriched surface layer and a chromium-ion-dominated middle layer. Although films of similar composition and thickness (i.e., about 2 nm) were formed in the two electrolytes, the corrosion currents were found to be three orders of magnitude larger in the acetic acid solution. The differences in the layer composition, found for the two electrolytes as well as different oxidation conditions, can be explained based on the oxidation potentials of the metals and the dissolution rates of the different metal ions.

  10. Evaluating the solid electrolyte interphase formed on silicon electrodes: A comparison of ex situ X-ray photoelectron spectroscopy and in situ neutron reflectometry

    SciTech Connect

    Doucet, Mathieu; Browning, Jim; Baldwin, J. K.; Winiarz, Jeffrey; Kaiser, Helmut; Taub, H.; Veith, Gabriel M.

    2016-04-15

    This work details the in situ characterization of the interface between a silicon electrode and an electrolyte using a linear fluorinated solvent molecule, 0.1 M lithium bis(trifluoromethanesulfonyl)imide (LiTFSI) in deuterated dimethyl perfluoroglutarate (d6-PF5M2) (1.87 x 10-2 mS/cm-1). The solid electrolyte interphase (SEI) composition and thickness determined via in situ neutron reflectometry (NR) and ex situ X-ray photoelectron spectroscopy (XPS) were compared. The data show that SEI expansion and contraction (breathing) during electrochemical cycling was observed via both techniques; however, ex situ XPS suggests that the SEI thickness increases during Si lithiation and decreases during delithiation, while in situ NR suggests the opposite. The most likely cause of this discrepancy is the selective removal of SEI components (top 20 nm of the SEI) during the electrode rinse process, required to remove electrolyte residue prior to ex situ analysis, demonstrating the necessity of performing SEI characterizations in situ.

  11. Evaluating the solid electrolyte interphase formed on silicon electrodes: A comparison of ex situ X-ray photoelectron spectroscopy and in situ neutron reflectometry

    DOE PAGES

    Doucet, Mathieu; Browning, Jim; Baldwin, J. K.; ...

    2016-04-15

    This work details the in situ characterization of the interface between a silicon electrode and an electrolyte using a linear fluorinated solvent molecule, 0.1 M lithium bis(trifluoromethanesulfonyl)imide (LiTFSI) in deuterated dimethyl perfluoroglutarate (d6-PF5M2) (1.87 x 10-2 mS/cm-1). The solid electrolyte interphase (SEI) composition and thickness determined via in situ neutron reflectometry (NR) and ex situ X-ray photoelectron spectroscopy (XPS) were compared. The data show that SEI expansion and contraction (breathing) during electrochemical cycling was observed via both techniques; however, ex situ XPS suggests that the SEI thickness increases during Si lithiation and decreases during delithiation, while in situ NR suggestsmore » the opposite. The most likely cause of this discrepancy is the selective removal of SEI components (top 20 nm of the SEI) during the electrode rinse process, required to remove electrolyte residue prior to ex situ analysis, demonstrating the necessity of performing SEI characterizations in situ.« less

  12. Electronic structure and correlation in β -T i3O5 and λ -T i3O5 studied by hard x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Kobayashi, Keisuke; Taguchi, Munetaka; Kobata, Masaaki; Tanaka, Kenji; Tokoro, Hiroko; Daimon, Hiroshi; Okane, Tetsuo; Yamagami, Hiroshi; Ikenaga, Eiji; Ohkoshi, Shin-ichi

    2017-02-01

    We have conducted hard x-ray photoelectron spectroscopy investigations of the electronic structure changes and electron correlation phenomena which take place upon the photoinduced reversible phase transition between β- and λ -T i3O . From valence band spectra of β- and λ -T i3O5 , we have identified the bipolaron caused by the σ-type bonding of dx y orbitals in β -T i3O5 and the π stacking between the dx y orbitals between different Ti sites in λ -T i3O5 , previously predicted by ab initio calculations. This indicates that the single electron band picture is valid for the description of photoinduced phase transitions. On the other hand, the Ti 2 p and Ti 1 s core level spectra exhibit nonlocal screening satellite features, which are typical spectroscopic signs of strong electron correlation in the coherent Ti t2 g states. The most striking result we obtain is that correlation in the valence band also manifests to reduce the plasmon energy, which results in an enhancement of the valence electron mass by a factor of 2.7.

  13. Influence of polymolybdate adsorbates on electrooxidation of ethanol at PtRu nanoparticles: Combined electrochemical, mass spectrometric and X-ray photoelectron spectroscopic studies

    NASA Astrophysics Data System (ADS)

    Gralec, Barbara; Lewera, Adam; Kulesza, Pawel J.

    2016-05-01

    The role Keggin-type phosphomolybdate (PMo12O403-) ions (adsorbed on carbon-supported PtRu, PtRu/C) on electrooxidation of ethanol is addressed here. The combined results obtained using Differential Electrochemical Mass Spectrometry, X-ray Photoelectron Spectroscopy and Cyclic Voltammetry are consistent with the view that presence of the Keggin-type polyoxometallate, phosphomolybdate, ions (adsorbates) leads to enlargement of the current densities associated with electrooxidation of ethanol at potentials greater than 700 mV vs. RHE. This increase of the anodic currents is correlated with the higher acetaldehyde yield which is likely to reflect changes in the reaction kinetics (e.g. more dynamic dehydrogenation of ethanol leading to acetaldehyde) or in the reaction mechanism defined by the preferential surface modification resulting not only in faster kinetics but also in higher selectivity with respect to acetaldehyde production. It is apparent from the spectroscopic data that modification of PtRu/C nanoparticles with phosphomolybdate ions leads to suppression of the formation of Ru surface oxides.

  14. A study of the O/Ag(111) system with scanning tunneling microscopy and x-ray photoelectron spectroscopy at ambient pressures

    NASA Astrophysics Data System (ADS)

    Heine, Christian; Eren, Baran; Lechner, Barbara A. J.; Salmeron, Miquel

    2016-10-01

    The interaction of O2 with the Ag(111) surface was studied with scanning tunneling microscopy (STM) in the pressure range from 10- 9 Torr to 1 atm at room temperature and with X-ray photoelectron spectroscopy (XPS) up to 0.3 Torr O2 in the temperature range from RT to 413 K. STM images show that the Ag(111) surface topography is little affected in regions with large flat terraces, except for the appearance of mobile features due to oxygen atoms at pressures above 0.01 Torr. In regions where the step density is high, the surface became rough under 0.01 Torr of O2, due to the local oxidation of Ag. Various chemical states of oxygen due to chemisorbed, oxide and subsurface species were identified by XPS as a function of pressure and temperature. The findings from the STM images and XPS measurements indicate that formation of an oxide phase, the thermodynamically stable form at room temperature under ambient O2 pressure, is kinetically hindered in the flat terrace areas but proceeds readily in regions with high-step density.

  15. [SIMS (secondary ion mass spectroscopy) and XPS (x-ray photoelectron spectroscopy) study of titanium implant surfaces coated with anodic titanium-oxide layer].

    PubMed

    Suba, Csongor; Velich, Norbert; Vida, György; Kovács, Lajos; Kiss, Gábor; Szabó, György

    2003-10-01

    The demands that must be satisfied by titanium implants applied in medical practice include chemical and physical durability. An anodic oxide protective layer formed on the surface of titanium implants serves for the better attainment of this aim. The composition of the passivizing layer and the changes in its thickness and binding state can be studied by method of material science, e.g. by secondary ion mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS). In this way a possibility arises for the material technological classification of the Ti-TiO2 layer structure and for the observation of the physical and chemical reactions that occur between the implants and the tissues in the organism. The present XPS examinations revealed that the binding state of the titanium forming the surface of the plates involve neither significant quantities of titanium oxide nor impurities. In the SIMS investigation the thickness of the titanium oxide layer was found to be 120-150 nm. Determination of the thickness of the surface, the binding state of the titanium and the exact proportions of the impurities and additives furnishes a possibility for a subsequent comparison with the surface structure of plates removed from the organism. It is important for the assessment of the practical value of the protective layer.

  16. X-ray Photoelectron Spectroscopy ofGaP_{1-x}N_x Photocorroded as a Result of Hydrogen Productionthrough Water Electrolysis

    SciTech Connect

    Mayer, Marie A.; /Illinois U., Urbana /SLAC

    2006-09-27

    Photoelectrochemical (PEC) cells produce hydrogen gas through the sunlight driven electrolysis of water. By extracting hydrogen and oxygen from water and storing solar energy in the H-H bond, they offer a promising renewable energy technology. Addition of dilute amounts of nitrogen to III-V semiconductors has been shown to dramatically increase the stability of these materials for hydrogen production. In an effort to learn more about the origin of semiconductor photocorrosion in PEC cells, three samples of p-type GaP with varying levels of nitrogen content (0%, 0.2%, 2%) were photocorroded and examined by X-ray Photoelectron Spectroscopy (XPS). GaPN samples were observed to be more efficient during the hydrogen production process than the pure GaP samples. Sample surfaces contained gallium oxides in the form of Ga{sub 2}O{sub 3} and Ga(OH){sub 3} and phosphorus oxide (P{sub 2}O{sub 5}), as well as surface oxides from exposure to air. A significant shift in intensity from bulk to surface peaks dramatic nitrogen segregation to the surface during photoelectrochemical hydrogen production. Further investigations, including using a scanning electron microscope to investigate sample topography and inductively coupled plasma mass spectroscopy (ICP-MS) analysis for solution analyses, are under way to determine the mechanism for these changes.

  17. Epitaxial BaTiO3(100) films on Pt(100): a low-energy electron diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy study.

    PubMed

    Förster, Stefan; Huth, Michael; Schindler, Karl-Michael; Widdra, Wolf

    2011-09-14

    The growth of epitaxial ultrathin BaTiO(3) films on a Pt(100) substrate has been studied by scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and x-ray photoelectron spectroscopy (XPS). The films have been prepared by radio-frequency-assisted magnetron sputter deposition at room temperature and develop a long-range order upon annealing at 900 K in O(2). By adjusting the Ar and O(2) partial pressures of the sputter gas, the stoichiometry was tuned to match that of a BaTiO(3)(100) single crystal as determined by XPS. STM reveals the growth of continuous BaTiO(3) films with unit cell high islands on top. With LEED already for monolayer thicknesses, the formation of a BaTiO(3)(100)-(1 × 1) structure has been observed. Films of 2-3 unit cell thickness show a brilliant (1 × 1) LEED pattern for which an extended set of LEED I-V data has been acquired. At temperatures above 1050 K the BaTiO(3) thin film starts to decay by formation of vacancy islands. In addition (4 × 4) and (3 × 3) surface reconstructions develop upon prolonged heating.

  18. The evolution of Ga and As core levels in the formation of Fe/GaAs (001):A high resolution soft x-ray photoelectron spectroscopic study

    SciTech Connect

    Thompson, Jamie; Neal, James; Shen, Tiehan; Morton, Simon; Tobin, James; Waddill, George Dan; Matthew, Jim; Greig, Denis; Hopkinson, Mark

    2008-07-14

    A high resolution soft x-ray photoelectron spectroscopic study of Ga and As 3d core levels has been conducted for Fe/GaAs (001) as a function of Fe thickness. This work has provided unambiguous evidence of substrate disrupting chemical reactions induced by the Fe overlayer--a quantitative analysis of the acquired spectra indicates significantly differing behavior of Ga and As during Fe growth, and our observations have been compared with existing theoretical models. Our results demonstrate that the outdiffusing Ga and As remain largely confined to the interface region, forming a thin intermixed layer. Whereas at low coverages Fe has little influence on the underlying GaAs substrate, the onset of substrate disruption when the Fe thickness reaches 3.5 Angstrom results in major changes in the energy distribution curves (EDCs) of both As and Ga 3d cores. Our quantitative analysis suggests the presence of two additional As environments of metallic character: one bound to the interfacial region and another which, as confirmed by in situ oxidation experiments, surface segregates and persists over a wide range of overlayer thickness. Analysis of the corresponding Ga 3d EDCs found not two, but three additional environments--also metallic in nature. Two of the three are interface resident whereas the third undergoes outdiffusion at low Fe coverages. Based on the variations of the integrated intensities of each component, we present a schematic of the proposed chemical makeup of the Fe/GaAs (001) system.

  19. The evolution of Ga and As core levels in the formation of Fe/GaAs (001): A high resolution soft x-ray photoelectron spectroscopic study

    SciTech Connect

    Thompson, Jamie D. W.; Neal, James R.; Shen, Tiehan H.; Morton, Simon A.; Tobin, James G.; Dan Waddill, G.; Matthew, Jim A. D.; Greig, Denis; Hopkinson, Mark

    2008-07-15

    A high resolution soft x-ray photoelectron spectroscopic study of Ga and As 3d core levels has been conducted for Fe/GaAs (001) as a function of Fe thickness. This work has provided unambiguous evidence of substrate disrupting chemical reactions induced by the Fe overlayer--a quantitative analysis of the acquired spectra indicates significantly differing behavior of Ga and As during Fe growth, and our observations have been compared with existing theoretical models. Our results demonstrate that the outdiffusing Ga and As remain largely confined to the interface region, forming a thin intermixed layer. Whereas at low coverages Fe has little influence on the underlying GaAs substrate, the onset of substrate disruption when the Fe thickness reaches 3.5 A results in major changes in the energy distribution curves (EDCs) of both As and Ga 3d cores. Our quantitative analysis suggests the presence of two additional As environments of metallic character: one bound to the interfacial region and another which, as confirmed by in situ oxidation experiments, surface segregates and persists over a wide range of overlayer thickness. Analysis of the corresponding Ga 3d EDCs found not two, but three additional environments--also metallic in nature. Two of the three are interface resident whereas the third undergoes outdiffusion at low Fe coverages. Based on the variations of the integrated intensities of each component, we present a schematic of the proposed chemical makeup of the Fe/GaAs (001) system.

  20. Water adsorption, solvation and deliquescence of alkali halide thin films on SiO2 studied by ambient pressure X-ray photoelectron spectroscopy

    SciTech Connect

    Arima, Kenta; Jiang, Peng; Deng, Xingyi; Bluhm, Henrik; Salmeron, Miquel

    2010-03-31

    The adsorption of water on KBr thin films evaporated onto SiO2 was investigated as a function of relative humidity (RH) by ambient pressure X-ray photoelectron spectroscopy. At 30percent RH adsorbed water reaches a coverage of approximately one monolayer. As the humidity continues to increase, the coverage of water remains constant or increases very slowly until 60percent RH, followed by a rapid increase up to 100percent RH. At low RH a significant number of the Br atoms are lost due to irradiation damage. With increasing humidity solvation increases ion mobility and gives rise to a partial recovery of the Br/K ratio. Above 60percent RH the increase of the Br/K ratio accelerates. Above the deliquescence point (85percent RH), the thickness of the water layer continues to increase and reaches more than three layers near saturation. The enhancement of the Br/K ratio at this stage is roughly a factor 2.3 on a 0.5 nm KBr film, indicating a strong preferential segregation of Br ions to the surface of the thin saline solution on SiO2.

  1. Manganese nanoclusters and MnSi{sub {approx}1.7} nanowires formed on Si(110): A comparative x-ray photoelectron spectroscopy study

    SciTech Connect

    Zou Zhiqiang; Shi Gaoming; Liu Xiaoyong; Sun Limin

    2013-01-14

    The growth of Mn on a Si(110) surface at room temperature (RT) and 550 Degree-Sign C has been investigated by scanning tunneling spectroscopy (STM) and X-ray photoelectron spectroscopy (XPS). STM observation shows that the growth at 550 Degree-Sign C results in the formation of nanowires (NWs), while that at RT produces only nanoclusters. The Mn 2p XPS spectra unambiguously reveal that the NWs are composed of MnSi{sub {approx}1.7} and the nanoclusters are composed of Mn. Curve-fitting analysis of the spectra shows that 64.9% of the NWs were oxidized due to atmospheric exposure during sample transfer, while the Mn nanoclusters were completely oxidized under the same conditions. This fact indicates that the MnSi{sub {approx}1.7} NWs have better oxidation resistance than the Mn clusters, which can be attributed to the protection effect of the SiO{sub 2} layer formed on the NWs and the smaller surface to volume ratio of the NWs comparing with the clusters. The binding energy of Mn 2p for the NWs exhibits a negative shift of {approx}0.5 eV with respect to the Mn metallic state, which is similar to the silicide state of earlier transition metals Ti and Cr, but different from that of later transition metals Fe and Ni. This negative shift can be attributed to the contribution of Madelung potential.

  2. Hard X-ray photoelectron spectroscopy of LixNi1-xO epitaxial thin films with a high lithium content

    NASA Astrophysics Data System (ADS)

    Kumara, L. S. R.; Sakata, Osami; Yang, Anli; Yamauchi, Ryosuke; Taguchi, Munetaka; Matsuda, Akifumi; Yoshimoto, Mamoru

    2014-07-01

    The core-level and valence-band electronic structures of LixNi1-xO epitaxial thin films with x = 0, 0.27, and 0.48 were studied by hard X-ray photoelectron spectroscopy. A double peak structure, consisting of a main peak and a shoulder peak, and a satellite structure were observed in the Ni 2p3/2 core-level spectra. The intensity ratio of the shoulder to main peak in this double peak structure increased with increasing lithium content in LixNi1-xO. This lithium doping dependence of the Ni 2p3/2 core-level spectra was investigated using an extended cluster model, which included the Zhang-Rice (ZR) doublet bound states arising from a competition between O 2p - Ni 3d hybridization and the Ni on-site Coulomb interaction. The results indicated that the change in the intensity ratio in the main peak is because of a reduction in the ZR doublet bound states from lithium substitutions. This strongly suggests that holes compensating Li doping in LixNi1-xO are of primarily ZR character.

  3. Band alignment of HfO2/In0.18Al0.82N determined by angle-resolved x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Owen, Man Hon Samuel; Bhuiyan, Maruf Amin; Zhang, Zheng; Pan, Ji Sheng; Tok, Eng Soon; Yeo, Yee-Chia

    2014-07-01

    The band-alignment of atomic layer deposited (ALD)-HfO2/In0.18Al0.82N was studied by high resolution angle-resolved X-ray photoelectron spectroscopy measurements. The band bending near the HfO2/In0.18Al0.82N interface was investigated, and the potential variation across the interface was taken into account in the band alignment calculation. It is observed that the binding energies for N 1s and Al 2p in In0.18Al0.82N decreases and the corresponding extracted valence band offsets increases with increasing θ (i.e., closer to the HfO2/In0.18Al0.82N interface), as a result of an upward energy band bending towards the HfO2/In0.18Al0.82N interface. The resultant valence band offset and the conduction band offset for the ALD-HfO2/In0.18Al0.82N interface calculated was found to be 0.69 eV and 1.01 eV, respectively.

  4. Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC

    SciTech Connect

    Aydogan, Pinar; Suzer, Sefik; Arslan, Engin; Cakmakyapan, Semih; Ozbay, Ekmel; Strupinski, Wlodek

    2015-09-21

    We report on an X-ray photoelectron spectroscopy (XPS) study of two graphene based devices that were analyzed by imposing a significant current under +3 V bias. The devices were fabricated as graphene layers(s) on hexagonal SiC substrates, either on the C- or Si-terminated faces. Position dependent potential distributions (IR-drop), as measured by variations in the binding energy of a C1s peak are observed to be sporadic for the C-face graphene sample, but very smooth for the Si-face one, although the latter is less conductive. We attribute these sporadic variations in the C-face device to the incomplete electrical decoupling between the graphene layer(s) with the underlying buffer and/or substrate layers. Variations in the Si2p and O1s peaks of the underlayer(s) shed further light into the electrical interaction between graphene and other layers. Since the potential variations are amplified only under applied bias (voltage-contrast), our methodology gives unique, chemically specific electrical information that is difficult to obtain by other techniques.

  5. X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface

    NASA Astrophysics Data System (ADS)

    Gunnella, R.; Castrucci, P.; Pinto, N.; Davoli, I.; Sébilleau, D.; de Crescenzi, M.

    1996-09-01

    We used the XPD (x-ray photoelectron diffraction) and AED (Auger electron diffraction) from Ge core levels to probe the crystalline structure of 3 and 6 ML of Ge epitaxially grown by molecular-beam epitaxy on the Si(001) surface. In order to check the film tetragonal distortion and the pseudomorphic growth morphology, we used two different temperatures of the substrate during the deposition: room temperature and 400 °C. Evidence for an interfacial intermixing has been found by means of the observation of the angular behavior of the intensity of the emitted electrons. We also investigated the effects of Sb as a surfactant on such an interface. In this case indications of a laminar growth of strained Ge overlayer with reduced intermixing is obtained when 1 ML of Sb is predeposited on the substrate. Furthermore making use of a multiple-scattering approach to reproduce the experimental XPD patterns, a higher amount of accessible information on the morphology of the interface, beyond the determination of the strain content, is obtained.

  6. X-ray photoelectron spectroscopy study on Fe and Co catalysts during the first stages of ethanol chemical vapor deposition for single-walled carbon nanotube growth

    SciTech Connect

    Oida, Satoshi; McFeely, Fenton R.; Bol, Ageeth A.

    2011-03-15

    Optimized chemical vapor deposition processes for single-walled carbon nanotube (SWCNT) can lead to the growth of dense, vertically aligned, mm-long forests of SWCNTs. Precise control of the growth process is however still difficult, mainly because of poor understanding of the interplay between catalyst, substrate and reaction gas. In this paper we use x-ray photoelectron spectroscopy (XPS) to study the interplay between Fe or Co catalysts, SiO{sub 2} and Al{sub 2}O{sub 3} substrates and ethanol during the first stages of SWCNT forest growth. With XPS we observe that ethanol oxidizes Fe catalysts at carbon nanotube (CNT) growth temperatures, which leads to reduced carbon nanotube growth. Ethanol needs to be decomposed by a hot filament or other technique to create a reducing atmosphere and reactive carbon species in order to grow vertically aligned single-walled carbon nanotubes from Fe catalysts. Furthermore, we show that Al{sub 2}O{sub 3}, unlike SiO{sub 2}, plays an active role in CNT growth using ethanol CVD. From our study we conclude that metallic Fe on Al{sub 2}O{sub 3} is the most optimal catalyst/substrate combination for high-yield SWCNT forest growth, using hot filament CVD with ethanol as the carbon containing gas.

  7. Degradation of all-vanadium redox flow batteries (VRFB) investigated by electrochemical impedance and X-ray photoelectron spectroscopy: Part 2 electrochemical degradation

    NASA Astrophysics Data System (ADS)

    Derr, Igor; Bruns, Michael; Langner, Joachim; Fetyan, Abdulmonem; Melke, Julia; Roth, Christina

    2016-09-01

    Electrochemical degradation (ED) of carbon felt electrodes was investigated by cycling of a flow through all-vanadium redox flow battery (VRFB) and conducting half-cell measurements with two reference electrodes inside the test bench. ED was detected using half-cell and full-cell electrochemical impedance spectroscopy (EIS) at different states of charge (SOC). Reversing the polarity of the battery to recover cell performance was performed with little success. Renewing the electrolyte after a certain amount of cycles restored the capacity of the battery. X-ray photoelectron spectroscopy (XPS) reveals that the amount of surface functional increases by more than a factor of 3 for the negative side as well as for the positive side. Scanning electron microscope (SEM) images show a peeling of the fiber surface after cycling the felts, which leads to a loss of electrochemically active surface area (ECSA). Long term cycling shows that ED has a stronger impact on the negative half-cell [V(II)/V(III)] than the positive half-cell [V(IV)/V(V)] and that the negative half-cell is the rate-determining half-cell for the VRFB.

  8. Atomic scale structure of the 5-fold surface of an AlPdMn quasicrystal: A quantitative X-Ray photoelectron diffraction analysis

    SciTech Connect

    Zheng, Jin-Cheng; Huan, C.H.A.; Wee, A.T.S.; Van Hove, M.A.; Fadley, C.S.; Shi, F.J.; Rotenberg, E.; Barman, S.R.; Paggel, J.J.; Horn, K.; Ebert, Ph.; Urban, K.

    2004-02-11

    The atomic scale structure of the 5-fold symmetric surface of an AlPdMn quasicrystal is investigated quantitatively by comparing x-ray photoelectron diffraction (XPD) simulations to experiment. The observed 5-fold symmetry of the diffraction patterns indicates that the surface is quasicrystalline with no hint of a reconstruction from the bulk structure. In analyzing the experimental data, many possible bulk terminations have been tested. Those few that fit best to the data have in common that they contain an Al-rich surface layer followed by a dense mixed Al/Pd/Mn layer. These best terminations, while not identical to each other, are suggested to form terraces coexisting on a real surface. Structural relaxations of the quasicrystal surface are also analyzed: mixing several best-fit terminations gives average best-fit interlayer spacing changes of Dd12 = -0.057 Angstrom, Dd24 = +0.159 Angstrom. These results are in good agreement with a prior structure determination by LEED on a sample that was prepared in a different manner.

  9. X-ray photoelectron spectroscopy of negative electrodes from high-power lithium-ion cells showing various levels of power fade

    SciTech Connect

    Herstedt, Marie; Abraham, Daniel P.; Kerr, John B.

    2004-02-28

    High-power lithium-ion cells for transportation applications are being developed and studied at Argonne National Laboratory. The current generation of cells containing LiNi{sub 0.8}Co{sub 0.15}Al{sub 0.05}O{sub 2}-based cathodes, graphite-based anodes, and LiPF6-based electrolytes show loss of capacity and power during accelerated testing at elevated temperatures. Negative electrode samples harvested from some cells that showed varying degrees of power and capacity fade were examined by X-ray photoelectron spectroscopy (XPS). The samples exhibited a surface film on the graphite, which was thicker on samples from cells that showed higher fade. Furthermore, solvent-based compounds were dominant on samples from low power fade cells, whereas LiPF{sub 6}-based products were dominant on samples from high power fade cells. The effect of sample rinsing and air exposure is discussed. Mechanisms are proposed to explain the formation of compounds suggested by the XPS data.

  10. An X-ray photoelectron spectroscopy study of the thermal oxidation and nitridation of Si(100)-2 × 1 by NO 2

    NASA Astrophysics Data System (ADS)

    Lutz, F.; Bischoff, J. L.; Kubler, L.; Bolmont, D.

    1993-12-01

    The interaction of NO 2 on clean reconstructed Si(100) surfaces has been studied by X-ray photoelectron spectroscopy (XPS) in large substrate temperature ( TS) and NO 2 pressure ranges. Our results support the adsorption of only completely dissociated or atomic species whatever TS between room temperature and 1100 K. The respective oxygen and nitrogen uptakes, given as a function of pressure and TS, are compared. For oxygen, a critical temperature TOc (pressure POc) for a given pressure POc (temperature TOc) separates the desorption or combustion mode from the passivating one, very similar to the oxidation by O 2. For nitrogen, similar evolutions with TS and pressure are evidenced only above 750 K, when oxygen desorption occurs. Below 750 K, oxidation prevails over nitrogen chemisorption with a nitrogen coverage limited to a fraction of a monolayer whatever the pressure. Above 750 K the nitrogen chemisorption rate is enhanced so that the TS range comprised between 750 K and TOc defines an oxynitridation stage where both substantial oxygen and nitrogen coverages are found. Above TOc, nearly pure nitridation is enabled by oxygen etching. In conjunction with coverage measurements, angle-resolved XPS was used to probe the in-depth distribution of the chemisorbed atoms in the TS range above 750 K. From the comparison of the O 1s and N 1s intensities it is concluded that the initial oxynitride occurs with the formation of nitrogen pile-up at the Si/Si-oxide interface.

  11. Analysis of passivated A-286 stainless steel surfaces for mass spectrometer inlet systems by Auger electron and X-ray photoelectron spectroscopy and scanning electron microscopy

    DOE PAGES

    Ajo, Henry; Blankenship, Donnie; Clark, Elliot

    2014-07-25

    In this study, various commercially available surface treatments are being explored for use on stainless steel components in mass spectrometer inlet systems. Type A-286 stainless steel coupons, approximately 12.5 mm in diameter and 3 mm thick, were passivated with one of five different surface treatments; an untreated coupon served as a control. The surface and near-surface microstructure and chemistry of the coupons were investigated using sputter depth profiling using Auger electron spectroscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM). All the surface treatments studied appeared to change the surface morphology dramatically, as evidenced by lack of tool marks onmore » the treated samples in SEM images. In terms of the passivation treatment, Vendors A-D appeared to have oxide layers that were very similar in thickness to each other (0.7–0.9 nm thick), as well as to the untreated samples (the untreated sample oxide layers appeared to be somewhat larger). Vendor E’s silicon coating appears to be on the order of 200 nm thick.« less

  12. Impact of water vapour and carbon dioxide on surface composition of C{sub 3}A polymorphs studied by X-ray photoelectron spectroscopy

    SciTech Connect

    Dubina, E.; Plank, J.; Black, L.

    2015-07-15

    The surface specific analytical method, X-ray photoelectron spectroscopy (XPS), has been used to study the effects of water vapour and CO{sub 2} on the cubic and orthorhombic polymorphs of C{sub 3}A. Significant differences between the two polymorphs were observed in the XPS spectra. Upon exposure to water vapour, both polymorphs produced C{sub 4}AH{sub 13} on their surfaces. Additionally, the sodium-doped o-C{sub 3}A developed NaOH and traces of C{sub 3}AH{sub 6} on its surface. Subsequent carbonation yielded mono carboaluminate on both polymorphs. Large amounts of Na{sub 2}CO{sub 3} also formed on the surface of o-C{sub 3}A as a result of carbonation of NaOH. Furthermore, the extent of carbonation was much more pronounced for o-C{sub 3}A{sub o} than for c-C{sub 3}A.

  13. Comparison of Ultrathin SiO2/Si(100) and SiO2/Si(111) Interfaces from Soft X-ray Photoelectron Spectroscopy

    SciTech Connect

    Ulrich,M.; Rowe, J.; Keister, J.; Niimi, H.; Fleming, L.; Lucovsky, G.

    2006-01-01

    The limitations of soft x-ray photoelectron spectroscopy (SXPS) for determining structural information of the SiO{sub 2}/Si interface for device-grade ultrathin ({approx}6-22 Angstroms) films of SiO{sub 2} prepared from crystalline silicon by remote plasma assisted oxidation are explored. The main focus of this article is the limitation of data analysis and sensitivity to structural parameters. In particular, annealing data shows a significant decrease in the integrated density of suboxide bonding arrangements as determined from analysis of SXPS data. These decreases and changes are interpreted as evidence for reorganization of specific interface bonding arrangements due to the annealing process. Moreover, these results suggest that sample preparation and processing history are both critical for defining the nature of the SiO{sub 2}/Si interface, and therefore its electrical properties. Quantitative estimates of the interface state densities are derived from SXPS data revealing {approx}2 monolayers (ML) of suboxide as prepared and {approx}1.5 ML of suboxide after rapid thermal annealing at 900 degrees C for both Si(100) and Si(111) substrates. Comparison of the individual suboxide bonding state densities indicate for both Si substrate crystallographic orientations that annealing causes a self-organization of the suboxide consistent with bond constraint theory.

  14. Auger and X-ray PhotoelectronSpectroscopy Study of the Density ofOxygen States in Bismuth, Aluminum, Silicon, and Uranium Oxides

    SciTech Connect

    Teterin, Yu A.; Ivanov, K.E.; Teterin, A. Yu; Lebedev, A.M.; Utkin, I.O.; Vukchevich, L.

    1998-08-03

    The correlation of relative partial electron density at the oxygen ions with the intensity of Auger O KLL lines in Bi2O3, Al2O3, SiO2 and UO2 has been determined by Auger and X-ray photoelectron spectroscopic methods. The dependence of the relative intensities of Auger O KL2-3L2-3 and O KL1L2-3-lines was characterized from the binding energy of O 1s electrons. The electron density of the outer valence levels of oxygen increases as the relative intensities of Anger OKL2-3L2-3 and O KL1L2-3-lines increase. The fine structure observed in the O KL1L2-3 Auger and the O 2s XPS spectra has been explained by the formation of inner valence molecular orbitals (IVMO) from the interaction of electrons of the O 2s and filled metal ns shells.

  15. Structural investigation on Ge{sub x}Sb{sub 10}Se{sub 90−x} glasses using x-ray photoelectron spectra

    SciTech Connect

    Wei, Wen-Hou; Xiang, Shen; Xu, Si-Wei; Wang, Rong-Ping; Fang, Liang

    2014-05-14

    The structure of Ge{sub x}Sb{sub 10}Se{sub 90−x} glasses (x = 7.5, 10, 15, 20, 25, 27.5, 30, and 32.5 at. %) has been investigated by x-ray photoelectron spectroscopy (XPS). Different structural units have been extracted and characterized by decomposing XPS core level spectra, the evolution of the relative concentration of each structural unit indicates that, the relative contributions of Se-trimers and Se-Se-Ge(Sb) structure decrease with increasing Ge content until they become zero at chemically stoichiometric glasses of Ge{sub 25}Sb{sub 10}Se{sub 65}, and then the homopolar bonds like Ge-Ge and Sb-Sb begin to appear in the spectra. Increase of homopolar bonds will extend band-tails into the gap and narrow the optical band gap. Thus, the glass with a stoichiometric composition generally has fewer defective bonds and larger optical bandgap.

  16. Comparative study of the oxidation of NiAl(100) by molecular oxygen and water vapor using ambient-pressure X-ray photoelectron spectroscopy

    DOE PAGES

    Liu, Qianqian; Qin, Hailang; Boscoboinik, Jorge Anibal; ...

    2016-10-11

    The oxidation behavior of NiAl(100) by molecular oxygen and water vapor under a near-ambient pressure of 0.2 Torr is monitored using ambient-pressure X-ray photoelectron spectroscopy. O2 exposure leads to the selective oxidation of Al at temperatures ranging from 40 to 500 °C. By contrast, H2O exposure results in the selective oxidation of Al at 40 and 200 °C, and increasing the oxidation temperature above 300 °C leads to simultaneous formation of both Al and Ni oxides. Furthermore, these results demonstrate that the O2 oxidation forms a nearly stoichiometric Al2O3 structure that provides improved protection to the metallic substrate by barringmore » the outward diffusion of metals. By contrast, the H2O oxidation results in the formation of a defective oxide layer that allows outward diffusion of Ni at elevated temperatures for simultaneous NiO formation.« less

  17. Application of near ambient pressure gas-phase X-ray photoelectron spectroscopy to the investigation of catalytic properties of copper in methanol oxidation

    NASA Astrophysics Data System (ADS)

    Prosvirin, Igor P.; Bukhtiyarov, Andrey V.; Bluhm, Hendrik; Bukhtiyarov, Valerii I.

    2016-02-01

    Application of near ambient pressure (NAP) X-ray photoelectron spectroscopy for characterization of catalytic properties of a heterogeneous catalyst through measurement and analysis of the core-level spectra from gas phase constituents, which become measurable in submillibar pressure range, has been demonstrated for the reaction of methanol oxidation over polycrystalline copper foil. To improve the accuracy of quantitative analysis of the gas phase signals for the routine XPS spectrometer with double Al/Mg anode used in these experiments, the sample was removed from XPS analysis zone, but it was still located in high-pressure gas cell. As consequence, only gas phase peaks from reagents and reaction products have been observed in XPS spectra. Quantitative analysis of the spectra has allowed us to calculate conversions of the reagents and yields of the reaction products, or, other words, to characterize the catalytic properties of the catalyst and to track their changes with temperature. Further comparison of the catalytic properties with concentration of the surface species measured by in situ XPS in separate experiments, but under the same conditions, gives a possibility to discuss the reaction mechanisms.

  18. Structural origin of Si-2p core-level shifts from Si(100)-c[4x2] surface: A spectral x-ray photoelectron diffraction study

    SciTech Connect

    Chen, X.; Tonner, B.P.; Denlinger, J.

    1997-04-01

    The authors have performed angle-resolved x-ray photoelectron diffraction (XPD) from a Si(100)-c(4x2) surface to study the structural origin of Si-2p core-level shifts. In the experiment, the highly resolved surface Si-2p core-level spectra were measured as a fine grid of hemisphere and photon energies, using the SpectroMicroscopy Facility {open_quotes}ultraESCA{close_quotes} instrument. By carefully decomposing the spectra into several surface peaks, the authors are able to obtain surface-atom resolved XPD patterns. Using a multiple scattering analysis, they derived a detailed atomic model for the Si(100)-c(4x2) surface. In this model, the asymmetric dimers were found tilted by 11.5 plus/minus 2.0 degrees with bond length of 2.32 plus/minus 0.05{angstrom}. By matching model XPD patterns to experiment, the authors can identify which atoms in the reconstructed surface are responsible for specific photoemission lines in the 2p spectrum.

  19. Multimode Surface Functional Group Determination: Combining Steady-State and Time-Resolved Fluorescence with X-ray Photoelectron Spectroscopy and Absorption Measurements for Absolute Quantification.

    PubMed

    Fischer, Tobias; Dietrich, Paul M; Unger, Wolfgang E S; Rurack, Knut

    2016-01-19

    The quantitative determination of surface functional groups is approached in a straightforward laboratory-based method with high reliability. The application of a multimode BODIPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows estimation of the labeling ratio, i.e., the ratio of functional groups carrying a label after reaction, from the elemental ratios of nitrogen and fluorine. The amount of label on the surface is quantified with UV/vis spectrophotometry based on the molar absorption coefficient as molecular property. The investigated surfaces with varying density are prepared by codeposition of 3-(aminopropyl)triethoxysilane (APTES) and cyanoethyltriethoxysilane (CETES) from vapor. These surfaces show high functional group densities that result in significant fluorescence quenching of surface-bound labels. Since alternative quantification of the label on the surface is available through XPS and photometry, a novel method to quantitatively account for fluorescence quenching based on fluorescence lifetime (τ) measurements is shown. Due to the complex distribution of τ on high-density surfaces, the stretched exponential (or Kohlrausch) function is required to determine representative mean lifetimes. The approach is extended to a commercial Rhodamine B isothiocyanate (RITC) label, clearly revealing the problems that arise from such charged labels used in conjunction with silane surfaces.

  20. Metal overlayers on organic functional groups of self-assembled monolayers: VIII. X-ray photoelectron spectroscopy of the Ni/COOH interface

    SciTech Connect

    Herdt, G.C.; Czanderna, A.W.

    1999-11-01

    The interaction of vacuum deposited Ni with the COOH organic functional groups of mercaptoundecanoic acid [HS(CH{sub 2}){sub 10}COOH] self-assembled monolayers formed on an Au substrate has been characterized with {ital in situ} x-ray photoelectron spectroscopy. Steady loss and complete disappearance of the hydroxyl component of O&hthinsp;1s peak at 532.8 eV provides evidence for the formation of a Ni{endash}O bond at the Ni/COOH interface. Further evidence for interfacial compound formation is provided by a binding energy shift in the high binding energy component of the Ni&hthinsp;2p{sub 3/2} peak from 854.8 to 854.4 eV for Ni coverages below {approximately}0.2 nm. These results are consistent with the donation of electrons from the deposited Ni to the COOH oxygens at low Ni coverages. The absence of the characteristic satellite feature in the Ni&hthinsp;2p peak excludes the possibility that a full electron charge is donated to each COOH organic functional group as a bidentate complex. However, the data are consistent with a two step reaction mechanism in which Ni initially reacts weakly with the oxygens in COOH below one monolayer coverage and then forms a complex above this coverage. {copyright} {ital 1999 American Vacuum Society.}

  1. Comparative study of the oxidation of NiAl(100) by molecular oxygen and water vapor using ambient-pressure X-ray photoelectron spectroscopy

    SciTech Connect

    Liu, Qianqian; Qin, Hailang; Boscoboinik, Jorge Anibal; Zhou, Guangwen

    2016-10-11

    The oxidation behavior of NiAl(100) by molecular oxygen and water vapor under a near-ambient pressure of 0.2 Torr is monitored using ambient-pressure X-ray photoelectron spectroscopy. O2 exposure leads to the selective oxidation of Al at temperatures ranging from 40 to 500 °C. By contrast, H2O exposure results in the selective oxidation of Al at 40 and 200 °C, and increasing the oxidation temperature above 300 °C leads to simultaneous formation of both Al and Ni oxides. Furthermore, these results demonstrate that the O2 oxidation forms a nearly stoichiometric Al2O3 structure that provides improved protection to the metallic substrate by barring the outward diffusion of metals. By contrast, the H2O oxidation results in the formation of a defective oxide layer that allows outward diffusion of Ni at elevated temperatures for simultaneous NiO formation.

  2. X ray photoelectron analysis of oxide-semiconductor interface after breakdown in Al{sub 2}O{sub 3}/InGaAs stacks

    SciTech Connect

    Shekhter, P.; Palumbo, F.; Cohen Weinfeld, K.; Eizenberg, M.

    2014-09-08

    In this work, the post-breakdown characteristics of metal gate/Al{sub 2}O{sub 3}/InGaAs structures were studied using surface analysis by x ray photoelectron spectroscopy. The results show that for dielectric breakdown under positive bias, localized filaments consisting of oxidized substrate atoms (In, Ga and As) were formed, while following breakdown under negative bias, a decrease of oxidized substrate atoms was observed. Such differences in the microstructure at the oxide-semiconductor interface after breakdown for positive and negative voltages are explained by atomic diffusion of the contact atoms into the gate dielectric in the region of the breakdown spot by the current induced electro-migration effect. These findings show a major difference between Al{sub 2}O{sub 3}/InGaAs and SiO{sub 2}/Si interfaces, opening the way to a better understanding of the breakdown characteristics of III-V complementary-metal-oxide-semiconductor technology.

  3. Acid-base interactions in amorphous solid dispersions of lumefantrine prepared by spray-drying and hot-melt extrusion using X-ray photoelectron spectroscopy.

    PubMed

    Song, Yang; Zemlyanov, Dmitry; Chen, Xin; Su, Ziyang; Nie, Haichen; Lubach, Joseph W; Smith, Daniel; Byrn, Stephen; Pinal, Rodolfo

    2016-12-05

    This study investigates drug-excipient interactions in amorphous solid dispersions (ASDs) of the model basic compound lumefantrine (LMN), with five acidic polymers. X-ray photoelectron spectroscopy (XPS) was used to measure the extent of the protonation of the tertiary amine in LMN by the five acidic polymers. The extent/efficiency of protonation of the ASDs was assessed a function of polymer type, manufacturing process (hot-melt extrusion vs. spray drying), and drug loading (DL). The most strongly acidic polymer, polystyrene sulfonic acid (PSSA) was found to be the most efficient polymer in protonating LMN, independently of manufacturing method and DL. The rank order for the protonation extent of LMN by each polymer is roughtly the same for both manufacturing processes. However, protonation efficiency of polymers of similar acidic strength ranged from ∼0% to 75% (HPMCAS and Eudragit L100-55, respectively), suggesting an important role of molecular/mixing effects. For some polymers, including Eudragit L100 55 and HPMCP, spray-drying resulted in higher protonation efficiency compared to hot-melt extrusion. This result is attributable to a more favorable encounter between acid and base groups, when exposed to each other in solution phase. Increasing DL led to decreased protonation efficiency in most cases, particularly for polyacrylic acid, despite having the highest content of acidic groups per unit mass. These results indicate that the combined effects of acid strength and mixing phenomena regulate the efficiency of acid-base interactions in the ASDs.

  4. Quantitative investigation of the photodegradation of polyethylene terephthalate film by friction force microscopy, contact-angle goniometry, and X-ray photoelectron spectroscopy.

    PubMed

    Hurley, Claire R; Leggett, Graham J

    2009-08-01

    Studies of the UV-induced photodegradation of poly(ethylene terephthalate) (PET) have been carried out using contact-angle goniometry, X-ray photoelectron spectroscopy (XPS), and friction force microscopy (FFM). The advancing contact angle of water, theta, decreased following exposure of free-standing PET films to UV light. Measurements of surface friction by FFM showed that the coefficient of friction mu increased as the degradation proceeded, reaching a limiting value after ca 200 min, in agreement with the contact angle data. Using a modified form of the Cassie equation, a quantitative analysis of the extent of modification could be carried out. There was a very close correlation between the coefficient of friction determined by FFM and the value of cos theta. XPS provided more detailed information on surface bonding that also correlated closely with the FFM data. Although FFM provides quantitative data on surface modification with nanometer-scale spatial resolution, it does not provide detailed structural information such as is provided by XPS. The oxygen content at the surface was found to increase as photo-generated radicals within the PET reacted with atmospheric oxygen. Increases in both ester and carbonyl contributions within XPS data accompanied this increase. It was concluded that the photodegradation process follows mainly Norrish type I reaction pathways, following previous work by Fechine et al and Grosstete et al.

  5. An XPS study of the adherence of refractory carbide, silicide, and boride RF-sputtered wear-resistant coatings. [X-ray Photoelectron Spectroscopy of steel surfaces

    NASA Technical Reports Server (NTRS)

    Brainard, W. A.; Wheeler, D. R.

    1978-01-01

    Radio frequency sputtering was used to deposit refractory carbide, silicide, and boride coatings on 440-C steel substrates. Both sputter etched and pre-oxidized substrates were used and the films were deposited with and without a substrate bias. The composition of the coatings was determined as a function of depth by X-ray photoelectron spectroscopy combined with argon ion etching. Friction and wear tests were conducted to evaluate coating adherence. In the interfacial region there was evidence that bias may produce a graded interface for some compounds. Biasing, while generally improving bulk film stoichiometry, can adversely affect adherence by removing interfacial oxide layers. Oxides of all film constituents except carbon and iron were present in all cases but the iron oxide coverage was only complete on the preoxidized substrates. The film and iron oxides were mixed in the MoSi2 and Mo2C films but layered in the Mo2B5 films. In the case of mixed oxides, preoxidation enhanced film adherence. In the layered case it did not.

  6. Influence of surface hydroxylation on 3-aminopropyltriethoxysilane growth mode during chemical functionalization of GaN Surfaces: an angle-resolved X-ray photoelectron spectroscopy Study.

    PubMed

    Arranz, A; Palacio, C; García-Fresnadillo, D; Orellana, G; Navarro, A; Muñoz, E

    2008-08-19

    A comparative study of the chemical functionalization of undoped, n- and p-type GaN layers grown on sapphire substrates by metal-organic chemical vapor deposition was carried out. Both types of samples were chemically functionalized with 3-aminopropyltriethoxysilane (APTES) using a well-established silane-based approach for functionalizing hydroxylated surfaces. The untreated surfaces as well as those modified by hydroxylation and APTES deposition were analyzed using angle-resolved X-ray photoelectron spectroscopy. Strong differences were found between the APTES growth modes on n- and p-GaN surfaces that can be associated with the number of available hydroxyl groups on the GaN surface of each sample. Depending on the density of surface hydroxyl groups, different mechanisms of APTES attachment to the GaN surface take place in such a way that the APTES growth mode changes from a monolayer to a multilayer growth mode when the number of surface hydroxyl groups is decreased. Specifically, a monolayer growth mode with a surface coverage of approximately 78% was found on p-GaN, whereas the formation of a dense film, approximately 3 monolayers thick, was observed on n-GaN.

  7. New insight brought by density functional theory on the chemical state of alaninol on Cu(100): Energetics and interpretation of x-ray photoelectron spectroscopy data

    NASA Astrophysics Data System (ADS)

    Irrera, S.; Costa, D.

    2008-03-01

    In recent years, an increasing interest has been focused on the adsorption of molecules on surfaces due to the importance of technologies based on the interaction of organic systems with metals and oxides for biosensors, catalysis, and molecularly imprinted polymer technology. A particularly attractive area is the study of chiral surfaces, as these can act as heterogeneous catalysts and sensors in the stereochemical industrial processes. This work reports on an ab initio simulation of chemisorption of the D-alaninol on Cu (100). This system has been investigated systematically by using the Vienna ab initio simulation Package (VASP) which performs density functional theory (DFT) calculations in periodic boundary conditions. Molecular dynamics at 300K is performed to explore all the possible geometries, finally, optimized at 0K to obtain the adsorption modes. C 1s, O 1s, and N 1s, core level shift (CLS) calculations of those adsorption modes have been evaluated and compared with x-ray photoelectron spectroscopy experimental data. Energetic and CLS indicate that both chemical functions, the NH2 and the dehydrogenated hydroxyl, are involved in the bonding to the surface at low coverage. Atomic hydrogen coadsorbs in a fourfold hollow site. An atomistic thermodynamics approach suggests that at room temperature under UHV conditions, coadsorbed hydrogen has recombined as H2 and desorbed from the surface.

  8. In situ study of oxidation states of platinum nanoparticles on a polymer electrolyte fuel cell electrode by near ambient pressure hard X-ray photoelectron spectroscopy.

    PubMed

    Takagi, Yasumasa; Wang, Heng; Uemura, Yohei; Nakamura, Takahiro; Yu, Liwei; Sekizawa, Oki; Uruga, Tomoya; Tada, Mizuki; Samjeské, Gabor; Iwasawa, Yasuhiro; Yokoyama, Toshihiko

    2017-02-22

    We performed in situ hard X-ray photoelectron spectroscopy (HAXPES) measurements of the electronic states of platinum nanoparticles on the cathode electrocatalyst of a polymer electrolyte fuel cell (PEFC) using a near ambient pressure (NAP) HAXPES instrument having an 8 keV excitation source. We successfully observed in situ NAP-HAXPES spectra of the Pt/C cathode catalysts of PEFCs under working conditions involving water, not only for the Pt 3d states with large photoionization cross-sections in the hard X-ray regime but also for the Pt 4f states and the valence band with small photoionization cross-sections. Thus, this setup allowed in situ observation of a variety of hard PEFC systems under operating conditions. The Pt 4f spectra of the Pt/C electrocatalysts in PEFCs clearly showed peaks originating from oxidized Pt(ii) at 1.4 V, which unambiguously shows that Pt(iv) species do not exist on the Pt nanoparticles even at such large positive voltages. The water oxidation reaction might take place at that potential (the standard potential of 1.23 V versus a standard hydrogen electrode) but such a reaction should not lead to a buildup of detectable Pt(iv) species. The voltage-dependent NAP-HAXPES Pt 3d spectra revealed different behaviors with increasing voltage (0.6 → 1.0 V) compared with decreasing voltage (1.0 → 0.6 V), showing a clear hysteresis. Moreover, quantitative peak-fitting analysis showed that the fraction of non-metallic Pt species matched the ratio of the surface to total Pt atoms in the nanoparticles, which suggests that Pt oxidation only takes place at the surface of the Pt nanoparticles on the PEFC cathode, and the inner Pt atoms do not participate in the reaction. In the valence band spectra, the density of electronic states near the Fermi edge reduces with decreasing particle size, indicating an increase in the electrocatalytic activity. Additionally, a change in the valence band structure due to the oxidation of platinum atoms was also

  9. Surface chemistry of a Cu(I) beta-diketonate precursor and the atomic layer deposition of Cu{sub 2}O on SiO{sub 2} studied by x-ray photoelectron spectroscopy

    SciTech Connect

    Dhakal, Dileep; Waechtler, Thomas; Schulz, Stefan E.; Gessner, Thomas; Lang, Heinrich; Mothes, Robert; Tuchscherer, André

    2014-07-01

    The surface chemistry of the bis(tri-n-butylphosphane) copper(I) acetylacetonate, [({sup n}Bu{sub 3}P){sub 2}Cu(acac)] and the thermal atomic layer deposition (ALD) of Cu{sub 2}O using this Cu precursor as reactant and wet oxygen as coreactant on SiO{sub 2} substrates are studied by in-situ x-ray photoelectron spectroscopy (XPS). The Cu precursor was evaporated and exposed to the substrates kept at temperatures between 22 °C and 300 °C. The measured phosphorus and carbon concentration on the substrates indicated that most of the [{sup n}Bu{sub 3}P] ligands were released either in the gas phase or during adsorption. No disproportionation was observed for the Cu precursor in the temperature range between 22 °C and 145 °C. However, disproportionation of the Cu precursor was observed at 200 °C, since C/Cu concentration ratio decreased and substantial amounts of metallic Cu were present on the substrate. The amount of metallic Cu increased, when the substrate was kept at 300 °C, indicating stronger disproportionation of the Cu precursor. Hence, the upper limit for the ALD of Cu{sub 2}O from this precursor lies in the temperature range between 145 °C and 200 °C, as the precursor must not alter its chemical and physical state after chemisorption on the substrate. Five hundred ALD cycles with the probed Cu precursor and wet O{sub 2} as coreactant were carried out on SiO{sub 2} at 145 °C. After ALD, in-situ XPS analysis confirmed the presence of Cu{sub 2}O on the substrate. Ex-situ spectroscopic ellipsometry indicated an average film thickness of 2.5 nm of Cu{sub 2}O deposited with a growth per cycle of 0.05 Å/cycle. Scanning electron microscopy and atomic force microscopy (AFM) investigations depicted a homogeneous, fine, and granular morphology of the Cu{sub 2}O ALD film on SiO{sub 2}. AFM investigations suggest that the deposited Cu{sub 2}O film is continuous on the SiO{sub 2} substrate.

  10. Quantification of the toxic hexavalent chromium content in an organic matrix by X-ray photoelectron spectroscopy (XPS) and ultra-low-angle microtomy (ULAM)

    NASA Astrophysics Data System (ADS)

    Greunz, Theresia; Duchaczek, Hubert; Sagl, Raffaela; Duchoslav, Jiri; Steinberger, Roland; Strauß, Bernhard; Stifter, David

    2017-02-01

    Cr(VI) is known for its corrosion inhibitive properties and is, despite legal regulations, still a potential candidate to be added to thin (1-3 μm) protective coatings applied on, e.g., electrical steel as used for transformers, etc. However, Cr(VI) is harmful to the environment and to the human health. Hence, a reliable quantification of it is of decisive interest. Commonly, an alkaline extraction with a photometric endpoint detection of Cr(VI) is used for such material systems. However, this procedure requires an accurate knowledge on sample parameters such as dry film thickness and coating density that are occasionally associated with significant experimental errors. We present a comprehensive study of a coating system with a defined Cr(VI) pigment concentration applied on electrical steel. X-ray photoelectron spectroscopy (XPS) was employed to resolve the elemental chromium concentration and the chemical state. Turning to the fact that XPS is extremely surface sensitive (<10 nm) and that the lowest commonly achievable lateral resolution is a number of times higher than the coating thickness (∼2 μm), a bulk analysis was achieved with XPS line scans on extended wedge-shaped tapers through the coating. For that purpose a special sample preparation step performed on an ultra-microtome was required prior to analysis. Since a temperature increase leads to a reduction of Cr(VI) we extend our method on samples, which were subjected to different curing temperatures. We show that our proposed approach now allows to determine the elemental and Cr(VI) concentration and distribution inside the coating.

  11. X-ray photoelectron spectroscopy of fast-frozen hematite colloids in aqueous solutions. 5. Halide ion (F-, Cl-, Br-, I-) adsorption.

    PubMed

    Shimizu, Kenichi; Shchukarev, Andrey; Kozin, Philipp A; Boily, Jean-François

    2013-02-26

    Halide anion (F(-), Cl(-), Br(-), and I(-)) adsorption and its impact on sodium adsorption at the hematite/water interface were studied by cryogenic X-ray photoelectron spectroscopy (XPS). Measurements were carried out on frozen, centrifuged wet hematite pastes that were previously equilibrated in 50 mM electrolytic solutions in the pH 2-11 range. XPS-derived halide ion surface loadings decreased in the order F(-) > I(-) ≈ Cl(-) > Br(-), whereas sodium loadings were in the order Na(F) > Na(I) > Na(Br) > Na(Cl). The greater sodium loadings in NaF and in NaI resulted from larger anion loadings in these systems. Bromide ion had the lowest loading among all halide ions despite having a charge-to-size ratio that is intermediate between those of Cl(-) and I(-). This unexpected result may have arisen from specific properties of the hematite/water interface, such as water structure and electric double layer thickness. Fluoride ion adsorption proceeded via the formation of hydrogen bonds with the surface hydroxo groups (e.g., ≡Fe-OH(2)···F(-) or ≡Fe-OH···F(-)). Surface-bound fluoride ions exert a greater charge-screening effect than the other halide anions, as demonstrated by considerably small zeta potential values. Fe-F bond formation was excluded as a possible interfacial process as the F 1s peak binding energy (684.2 eV) was more comparable to that of NaF (684.6 eV) than FeF(3) (685.4 eV). Overall, these findings motivate further refinements of existing thermodynamic adsorption models for predicting the ionic composition of hematite particle surfaces contacted with sodium halide aqueous solutions.

  12. sp2/sp3 hybridization ratio in amorphous carbon from C 1s core-level shifts: X-ray photoelectron spectroscopy and first-principles calculation

    NASA Astrophysics Data System (ADS)

    Haerle, Rainer; Riedo, Elisa; Pasquarello, Alfredo; Baldereschi, Alfonso

    2002-01-01

    Using a combined experimental and theoretical approach, we address C 1s core-level shifts in amorphous carbon. Experimental results are obtained by x-ray photoelectron spectroscopy (XPS) and electron-energy-loss spectroscopy (EELS) on thin-film samples of different atomic density, obtained by a pulsed-laser deposition growth process. The XPS spectra are deconvoluted into two contributions, which are attributed to sp2- and sp3-hybridized atoms, respectively, separated by 0.9 eV, independent of atomic density. The sp3 hybridization content extracted from XPS is consistent with the atomic density derived from the plasmon energy in the EELS spectrum. In our theoretical study, we generate several periodic model structures of amorphous carbon of different densities applying two schemes of increasing accuracy in sequence. We first use a molecular-dynamics approach, based on an environmental-dependent tight-binding Hamiltonian to quench the systems from the liquid phase. The final model structures are then obtained by further atomic relaxation using a first-principles pseudopotential plane-wave approach within density-functional theory. Within the latter framework, we also calculate carbon 1s core-level shifts for our disordered model structures. We find that the shifts associated to threefold- and fourfold- coordinated carbon atoms give rise to two distinct peaks separated by about 1.0 eV, independent of density, in close agreement with experimental observations. This provides strong support for decomposing the XPS spectra into two peaks resulting from sp2- and sp3-hybridized atoms. Core-hole relaxations effects account for about 30% of the calculated shifts.

  13. Investigation of sulfur forms and transformation during the co-combustion of sewage sludge and coal using X-ray photoelectron spectroscopy.

    PubMed

    Li, Pei-Sheng; Hu, Yi; Yu, Wan; Yue, Ya-Nan; Xu, Qiao; Hu, Song; Hu, Nian-Su; Yang, Jun

    2009-08-15

    X-ray photoelectron spectroscopy was used to investigate the characteristics and evolution of sulfur (S) in mixtures of bituminous coal and sewage sludge (SS) and their chars during isothermal combustion. Five groups of mixtures with SS content of 0%, 10%, 20%, 30% and 100%, were examined at different burn-off ratios (beta) of 0, 30%, 50%, 70% and 100%. The S in the coal mainly exist as the forms of mercaptan (S1), sulfide (S2), thiophene (S3), sulfoxide (S4), sulfone (S5) and sulfate (S6). During the coal combustion process, the content of S1 and S2 decreased, while that of S3 and S5 increased in the early stage and decreased in the late stage. The S4 content increased throughout the entire process of combustion. Small amount of S6 was detected, showing a fluctuated pattern. The trend of S1, S2, S5 and S6 in SS was alike with that in coal, whereas S4 decreased at the end of combustion. The changing process of S3 in SS was opposite to that of coal, while the composition of S in the mixtures resulted from the mixing of coal and SS. The transformation of each functional group during co-combustion were correlated with their transformation characteristics during the mono-combustion of coal and SS, and no obvious interaction was observed, which demonstrated that the coal-origin and SS-origin sulfur in mixtures kept their own characteristics in the combustion. SS may accumulate on the solid surface as alpha increase, resulting its significant influence on the evolution of each form of S. When alpha was low, most of the S-contained functional groups presented the characteristics of coal. The percentage of coal-origin functional groups declined as alpha increased. The transforming trends of most functional groups were similar with that of SS when alpha reached 30%.

  14. Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Nomura, Kenji; Kamiya, Toshio; Ikenaga, Eiji; Yanagi, Hiroshi; Kobayashi, Keisuke; Hosono, Hideo

    2011-04-01

    In a previous work, we examined subgap states in highly doped amorphous In-Ga-Zn-O (a-IGZO) films by hard x-ray photoelectron spectroscopy (HX-PES) and found they had subgap electronic states above the valence band maximum (VBM) with the densities > 5 × 1020 cm-3 and just below the Fermi level with the densities > 5 × 1019 cm-3 [K. Nomura, T. Kamiya, H. Yanagi, E. Ikenaga, K. Yang, K. Kobayashi, M. Hirano, and H. Hosono, Appl. Phys. Lett. 92, 202117 (2008)]; however, their electron densities (Ne > 3 × 1019 cm-3) are rather high and not compatible with rational properties required for active channel layers in thin-film transistors (TFTs). In this work, we report the effects of Ne and thermal annealing on the subgap states in order to provide the data useful for actual TFTs. It was found that the low-Ne a-IGZO films had extra subgap states above VBM similar to the previous report, but their densities were as small as ˜2.0 × 1020 cm-3 for the highly resistive, wet-annealed a-IGZO films. Angle-dependent HX-PES revealed that the subgap states above VBM concentrate in the surface region. The O 1s peak indicated that the wet annealing suppressed the generation of subgap states by terminating these states with -OH bonds. The subgap states below EF were observed commonly in all the samples including ZnO, crystalline (c-) IGZO and a-IGZO. It is concluded that these states below EF are neither related to the disordered structures of a-IGZO nor to their TFT characteristics. It is considered that these states are related to the metastable states created by the high-energy photons in vacuum.

  15. Near-Ambient-Pressure X-ray Photoelectron Spectroscopy Study of Methane-Induced Carbon Deposition on Clean and Copper-Modified Polycrystalline Nickel Materials.

    PubMed

    Rameshan, Raffael; Mayr, Lukas; Klötzer, Bernhard; Eder, Dominik; Knop-Gericke, Axel; Hävecker, Michael; Blume, Raoul; Schlögl, Robert; Zemlyanov, Dmitry Y; Penner, Simon

    2015-12-03

    In order to simulate solid-oxide fuel cell (SOFC)-related coking mechanisms of Ni, methane-induced surface carbide and carbon growth was studied under close-to-real conditions by synchrotron-based near-ambient-pressure (NAP) X-ray photoelectron spectroscopy (XPS) in the temperature region between 250 and 600 °C. Two complementary polycrystalline Ni samples were used, namely, Ni foam-serving as a model structure for bulk Ni in cermet materials such as Ni/YSZ-and Ni foil. The growth mechanism of graphene/graphite species was found to be closely related to that previously described for ethylene-induced graphene growth on Ni(111). After a sufficiently long "incubation" period of the Ni foam in methane at 0.2 mbar and temperatures around 400 °C, cooling down to ∼250 °C, and keeping the sample at this temperature for 50-60 min, initial formation of a near-surface carbide phase was observed, which exhibited the same spectroscopic fingerprint as the C2H4 induced Ni2C phase on Ni(111). Only in the presence of this carbidic species, subsequent graphene/graphite nucleation and growth was observed. Vice versa, the absence of this species excluded further graphene/graphite formation. At temperatures above 400 °C, decomposition/bulk dissolution of the graphene/graphite phase was observed on the rather "open" surface of the Ni foam. In contrast, Ni foil showed-under otherwise identical conditions-predominant formation of unreactive amorphous carbon, which can only be removed at ≥500 °C by oxidative clean-off. Moreover, the complete suppression of carbide and subsequent graphene/graphite formation by Cu-alloying of the Ni foam and by addition of water to the methane atmosphere was verified.

  16. In situ x-ray photoelectron spectroscopic and density-functional studies of Si atoms adsorbed on a C60 film.

    PubMed

    Onoe, Jun; Nakao, Aiko; Hara, Toshiki

    2004-12-08

    The interaction between C(60) and Si atoms has been investigated for Si atoms adsorbed on a C(60) film using in situ x-ray photoelectron spectroscopy (XPS) and density-functional (DFT) calculations. Analysis of the Si 2p core peak identified three kinds of Si atoms adsorbed on the film: silicon suboxides (SiO(x)), bulk Si crystal, and silicon atoms bound to C(60). Based on the atomic percent ratio of silicon to carbon, we estimated that there was approximately one Si atom bound to each C(60) molecule. The Si 2p peak due to the Si-C(60) interaction demonstrated that a charge transfer from the Si atom to the C(60) molecule takes place at room temperature, which is much lower than the temperature of 670 K at which the charge transfer was observed for C(60) adsorbed on Si(001) and (111) clean surfaces [Sakamoto et al., Phys. Rev. B 60, 2579 (1999)]. The number of electrons transferred between the C(60) molecule and Si atom was estimated to be 0.59 based on XPS results, which is in good agreement with the DFT result of 0.63 for a C(60)Si with C(2v) symmetry used as a model cluster. Furthermore, the shift in binding energy of both the Si 2p and C 1s core peaks before and after Si-atom deposition was experimentally obtained to be +2.0 and -0.4 eV, respectively. The C(60)Si model cluster provides the shift of +2.13 eV for the Si 2p core peak and of -0.28 eV for the C 1s core peak, which are well corresponding to those experimental results. The covalency of the Si-C(60) interaction was also discussed in terms of Mulliken overlap population between them.

  17. X-ray photoelectron spectroscopy study of high-k CeO{sub 2}/La{sub 2}O{sub 3} stacked dielectrics

    SciTech Connect

    Zhang, Jieqiong; Wong, Hei; Yu, Danqun; Kakushima, Kuniyuki; Iwai, Hiroshi

    2014-11-15

    This work presents a detailed study on the chemical composition and bond structures of CeO{sub 2}/La{sub 2}O{sub 3} stacked gate dielectrics based on x-ray photoelectron spectroscopy (XPS) measurements at different depths. The chemical bonding structures in the interfacial layers were revealed by Gaussian decompositions of Ce 3d, La 3d, Si 2s, and O 1s photoemission spectra at different depths. We found that La atoms can diffuse into the CeO{sub 2} layer and a cerium-lanthanum complex oxide was formed in between the CeO{sub 2} and La{sub 2}O{sub 3} films. Ce{sup 3+} and Ce{sup 4+} states always coexist in the as-deposited CeO{sub 2} film. Quantitative analyses were also conducted. The amount of CeO{sub 2} phase decreases by about 8% as approaching the CeO{sub 2}/La{sub 2}O{sub 3} interface. In addition, as compared with the single layer La{sub 2}O{sub 3} sample, the CeO{sub 2}/La{sub 2}O{sub 3} stack exhibits a larger extent of silicon oxidation at the La{sub 2}O{sub 3}/Si interface. For the CeO{sub 2}/La{sub 2}O{sub 3} gate stack, the out-diffused lanthanum atoms can promote the reduction of CeO{sub 2} which produce more atomic oxygen. This result confirms the significant improvement of electrical properties of CeO{sub 2}/La{sub 2}O{sub 3} gated devices as the excess oxygen would help to reduce the oxygen vacancies in the film and would suppress the formation of interfacial La-silicide also.

  18. Impact of Premetallization Surface Preparation on Nickel-based Ohmic Contacts to Germanium Telluride: An X-ray Photoelectron Spectroscopic Study.

    PubMed

    Aldosari, Haila M; Simchi, Hamed; Ding, Zelong; Cooley, Kayla A; Yu, Shih-Ying; Mohney, Suzanne E

    2016-12-21

    Surfaces of polycrystalline α-GeTe films were studied by X-ray photoelectron spectroscopy (XPS) after different treatments in an effort to understand the effect of premetallization surface treatments on the resistance of Ni-based contacts to GeTe. UV-O3 is often used to remove organic contaminants after lithography and prior to metallization; therefore, UV-O3 treatment was used first for 10 min prior to ex situ treatments, which led to oxidation of both Ge and Te to GeOx (x < 2) and TeO2, respectively. Then the oxides were removed by deionized (DI) H2O, (NH4)2S, and HCl treatments. Additionally, in situ Ar(+) ion etching was used to clean the GeTe surface without prior UV-O3 treatment. Ar(+) ion etching, H2O, and (NH4)2S treatments create a surface richer in Ge compared to the HCl treatment, after which the surface is Te-rich. However, (NH4)2S also oxidizes Ge and gradually etches the GeTe film. All treated surfaces showed poor stability upon prolonged exposure to air, revealing that even (NH4)2S does not passivate the GeTe surface. The refined transfer length method (RTLM) was used to measure the contact resistance (Rc) of as-deposited Ni-based contacts to GeTe as a function of premetallization surface preparation. HCl-treated samples had the highest Rc (0.036 ± 0.002 Ω·mm), which was more than twice that of the other surface treatments. This increase in Rc is attributed to formation of the Ni1.29Te phase at the Ni/GeTe interface due to an abundance of Te at the surface after HCl treatment. In general, treatments that resulted in Ge-rich surfaces offered lower Rc.

  19. An X-ray photoelectron spectroscopy study of surface changes on brominated and sulfur-treated activated carbon sorbents during mercury capture: performance of pellet versus fiber sorbents.

    PubMed

    Saha, Arindom; Abram, David N; Kuhl, Kendra P; Paradis, Jennifer; Crawford, Jenni L; Sasmaz, Erdem; Chang, Ramsay; Jaramillo, Thomas F; Wilcox, Jennifer

    2013-12-03

    This work explores surface changes and the Hg capture performance of brominated activated carbon (AC) pellets, sulfur-treated AC pellets, and sulfur-treated AC fibers upon exposure to simulated Powder River Basin-fired flue gas. Hg breakthrough curves yielded specific Hg capture amounts by means of the breakthrough shapes and times for the three samples. The brominated AC pellets showed a sharp breakthrough after 170-180 h and a capacity of 585 μg of Hg/g, the sulfur-treated AC pellets exhibited a gradual breakthrough after 80-90 h and a capacity of 661 μg of Hg/g, and the sulfur-treated AC fibers showed no breakthrough even after 1400 h, exhibiting a capacity of >9700 μg of Hg/g. X-ray photoelectron spectroscopy was used to analyze sorbent surfaces before and after testing to show important changes in quantification and oxidation states of surface Br, N, and S after exposure to the simulated flue gas. For the brominated and sulfur-treated AC pellet samples, the amount of surface-bound Br and reduced sulfur groups decreased upon Hg capture testing, while the level of weaker Hg-binding surface S(VI) and N species (perhaps as NH4(+)) increased significantly. A high initial concentration of strong Hg-binding reduced sulfur groups on the surface of the sulfur-treated AC fiber is likely responsible for this sorbent's minimal accumulation of S(VI) species during exposure to the simulated flue gas and is linked to its superior Hg capture performance compared to that of the brominated and sulfur-treated AC pellet samples.

  20. Electronic structure and optical properties of Cs2HgCl4: DFT calculations and X-ray photoelectron spectroscopy measurements

    NASA Astrophysics Data System (ADS)

    Lavrentyev, A. A.; Gabrelian, B. V.; Vu, V. T.; Parasyuk, O. V.; Fedorchuk, A. O.; Khyzhun, O. Y.

    2016-10-01

    A high-quality single crystal of cesium mercury tetrabromide, Cs2HgCl4, was synthesized by using the vertical Bridgman-Stockbarger method and its electronic structure was studied from both experimental and theoretical viewpoints. In particular, X-ray photoelectron spectra were measured for both pristine and Ar+ ion-bombarded Cs2HgCl4 single crystal surfaces. The present XPS measurements indicate that the Cs2HgCl4 single crystal surface is sensitive with respect to Ar+ ion-bombardment: such a treatment changes substantially its elemental stoichiometry. With the aim of exploring total and partial densities of states within the valence band and conduction band regions of the Cs2HgCl4 compound, band-structure calculations based on density functional theory (DFT) using the augmented plane wave + local orbitals (APW + lo) method as incorporated within the WIEN2k package are performed. The calculations indicate that the Cl 3p states are the principal contributors in the upper portion of the valence band, while the Hg 5d and Cs 5p states dominate in its lower portion. In addition, the calculations allow for concluding that the unoccupied Cl p and Hg s states are the main contributors to the bottom of the conduction band. Furthermore, main optical characteristics of Cs2HgCl4, namely dispersion of the absorption coefficient, real and imaginary parts of dielectric function, electron energy-loss spectrum, refractive index, extinction coefficient and optical reflectivity, are elucidated based on the DFT calculations.

  1. Band alignment and interfacial chemical structure of the HfLaO/InGaZnO4 heterojunction investigated by x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Qian, Ling-Xuan; Wu, Ze-Han; Zhang, Yi-Yu; Liu, Yuan; Song, Jia-Qi; Liu, Xing-Zhao; Li, Yan-Rong

    2017-04-01

    Amorphous InGaZnO4 thin film transistors (a-IGZO TFTs) with HfLaO gate dielectrics have been widely demonstrated to possess extremely excellent electrical characteristics, and thus show great potential for applications in various next-generation electronic products. Nevertheless, the in-depth understanding of HfLaO/IGZO interfacial features is still lacking, which makes further device optimization lack clear guidance. In this work, the band alignment and interfacial chemical structure of a sputtering-prepared HfLaO/IGZO heterojunction was investigated through x-ray photoelectron spectroscopy. The valence and conduction band offsets (ΔE v and ΔE c) at the interface were determined to be 0.57 eV and 1.48 eV, respectively. The relatively large ΔE v is mainly attributed to the formation of the interfacial layer (IL) and thus the upward band bending from IGZO to the surface of HfLaO. Furthermore, it was found that the oxygen vacancies on the surface of IGZO were significantly suppressed upon the deposition of HfLaO, which not only explained the previously reported ultrahigh performance of a-IGZO/HfLaO TFTs to some extent, but also additionally validated the formation of the IL. Our findings have successfully revealed the importance of ILs in modifying the band alignment and interfacial trap states of HfLaO/IGZO heterojunctions, thus suggesting a potential route to further optimizing a-IGZO/HfLaO TFTs so as to satisfy the requirements of next-generation technologies.

  2. Near-Ambient-Pressure X-ray Photoelectron Spectroscopy Study of Methane-Induced Carbon Deposition on Clean and Copper-Modified Polycrystalline Nickel Materials

    PubMed Central

    2015-01-01

    In order to simulate solid-oxide fuel cell (SOFC)-related coking mechanisms of Ni, methane-induced surface carbide and carbon growth was studied under close-to-real conditions by synchrotron-based near-ambient-pressure (NAP) X-ray photoelectron spectroscopy (XPS) in the temperature region between 250 and 600 °C. Two complementary polycrystalline Ni samples were used, namely, Ni foam—serving as a model structure for bulk Ni in cermet materials such as Ni/YSZ—and Ni foil. The growth mechanism of graphene/graphite species was found to be closely related to that previously described for ethylene-induced graphene growth on Ni(111). After a sufficiently long “incubation” period of the Ni foam in methane at 0.2 mbar and temperatures around 400 °C, cooling down to ∼250 °C, and keeping the sample at this temperature for 50–60 min, initial formation of a near-surface carbide phase was observed, which exhibited the same spectroscopic fingerprint as the C2H4 induced Ni2C phase on Ni(111). Only in the presence of this carbidic species, subsequent graphene/graphite nucleation and growth was observed. Vice versa, the absence of this species excluded further graphene/graphite formation. At temperatures above 400 °C, decomposition/bulk dissolution of the graphene/graphite phase was observed on the rather “open” surface of the Ni foam. In contrast, Ni foil showed—under otherwise identical conditions—predominant formation of unreactive amorphous carbon, which can only be removed at ≥500 °C by oxidative clean-off. Moreover, the complete suppression of carbide and subsequent graphene/graphite formation by Cu-alloying of the Ni foam and by addition of water to the methane atmosphere was verified. PMID:26692914

  3. Effect of the Content of Ammonium Dichromate in Dichromated Gelatin on Cr 2 P 3 2 X-Ray Photoelectron Spectroscopy

    NASA Astrophysics Data System (ADS)

    Xiong, Liang-Wen; Peng, Bi-Xian

    1999-01-01

    The effect of the content of (NH 4 ) 2 Cr 2 O 7 in dichromated gelatin (DCG) on the binding energy of the Cr 2 P 3 2 level was studied with x-ray photoelectron spectroscopy. It was found that the binding energy of the Cr 2 P 3 2 level of chromium in DCG is lower than that of pure ammonium dichromate. When the content of (NH 4 ) 2 Cr 2 O 7 is not greater than 1%, the chromium in DCG has only one state, near 577.5 eV; when this content is between 1% and 20%, the chromium in DCG has two states, near 577.5 and 579.1 eV. The relative contents of these two states change with the content of (NH 4 ) 2 Cr 2 O 7 . As the (NH 4 ) 2 Cr 2 O 7 content increases, the relative content of the state near 577.5 eV decreases almost linearly, but its absolute content first increases, then reaches a maximum at 10% (NH 4 ) 2 Cr 2 O 7 , and finally decreases. In addition, the absolute content of the state near 577.5 eV changes very slowly between 5% and 15% (NH 4 ) 2 Cr 2 O 7 . According to these experimental results and holography data reported in the literature, it is inferred that the chromium of the state near 577.5 eV is the chromium that forms the latent image center after exposure and then forms the hologram after development. As a result the basis for the optimum content of (NH 4 ) 2 Cr 2 O 7 is found, and an approach to increasing sensitivity is suggested through this experiment.

  4. Effect of the content of ammonium dichromate in dichromated gelatin on Cr 2P3/2 X-ray photoelectron spectroscopy.

    PubMed

    Xiong, L W; Peng, B X

    1999-01-10

    The effect of the content of (NH(4))(2)Cr(2)O(7) in dichromated gelatin (DCG) on the binding energy of the Cr 2P(3/2) level was studied with x-ray photoelectron spectroscopy. It was found that the binding energy of the Cr 2P(3/2) level of chromium in DCG is lower than that of pure ammonium dichromate. When the content of (NH(4))(2)Cr(2)O(7) is not greater than 1%, the chromium in DCG has only one state, near 577.5 eV; when this content is between 1% and 20%, the chromium in DCG has two states, near 577.5 and 579.1 eV. The relative contents of these two states change with the content of (NH(4))(2)Cr(2)O(7). As the (NH(4))(2)Cr(2)O(7) content increases, the relative content of the state near 577.5 eV decreases almost linearly, but its absolute content first increases, then reaches a maximum at ~10% (NH(4))(2)Cr(2)O(7), and finally decreases. In addition, the absolute content of the state near 577.5 eV changes very slowly between 5% and 15% (NH(4))(2)Cr(2)O(7). According to these experimental results and holography data reported in the literature, it is inferred that the chromium of the state near 577.5 eV is the chromium that forms the latent image center after exposure and then forms the hologram after development. As a result the basis for the optimum content of (NH(4))(2)Cr(2)O(7) is found, and an approach to increasing sensitivity is suggested through this experiment.

  5. An X-ray photoelectron spectroscopy study of BF3 adsorption on positively and negatively poled LiNbO3 (0001)

    NASA Astrophysics Data System (ADS)

    Herdiech, M. W.; Mönig, H.; Altman, E. I.

    2014-08-01

    Adsorption of the strong Lewis acid BF3 was investigated to probe the sensitivity of the Lewis basicity of surface oxygens on LiNbO3 (0001) to the ferroelectric polarization direction. Adsorption and desorption were characterized by using X-ray photoelectron spectroscopy (XPS) to monitor the intensity and binding energy of the F 1s core level as a function of BF3 exposure and temperature. The results indicate that both BF3 uptake and desorption are very similar on the positively and negatively poled surfaces. In particular, BF3 only weakly adsorbs with the majority of the adsorbed BF3 desorbing below 200 K. Despite the similarities in the uptake and desorption behavior, the binding energy of the F 1s peak relative to the substrate Nb 3d5/2 peak was sensitive to the polarization direction, with the F 1s peak occurring at a binding energy up to 0.3 eV lower on positively poled than negatively poled LiNbO3 for equivalent BF3 exposures. Rather than reflecting a difference in bonding to the surface, however, this shift could be associated with oppositely oriented dipoles at the positively and negatively poled surfaces creating opposite band offsets between the adsorbate and the substrate. A similar effect was observed with lead zirconate titanate thin films where the Pb 4f XPS peak position changes as a function of temperature as a result of the pyroelectric effect which changes the magnitude of the surface and interface dipoles.

  6. Competition between organics and bromide at the aqueous solution-air interface as seen from ozone uptake kinetics and X-ray photoelectron spectroscopy.

    PubMed

    Lee, Ming-Tao; Brown, Matthew A; Kato, Shunsuke; Kleibert, Armin; Türler, Andreas; Ammann, Markus

    2015-05-14

    A more detailed understanding of the heterogeneous chemistry of halogenated species in the marine boundary layer is required. Here, we studied the reaction of ozone (O3) with NaBr solutions in the presence and absence of citric acid (C6H8O7) under ambient conditions. Citric acid is used as a proxy for oxidized organic material present at the ocean surface or in sea spray aerosol. On neat NaBr solutions, the observed kinetics is consistent with bulk reaction-limited uptake, and a second-order rate constant for the reaction of O3 + Br(-) is 57 ± 10 M(-1) s(-1). On mixed NaBr-citric acid aqueous solutions, the uptake kinetics was faster than that predicted by bulk reaction-limited uptake and also faster than expected based on an acid-catalyzed mechanism. X-ray photoelectron spectroscopy (XPS) on a liquid microjet of the same solutions at 1.0 × 10(-3)-1.0 × 10(-4) mbar was used to obtain quantitative insight into the interfacial composition relative to that of the bulk solutions. It revealed that the bromide anion becomes depleted by 30 ± 10% while the sodium cation gets enhanced by 40 ± 20% at the aqueous solution-air interface of a 0.12 M NaBr solution mixed with 2.5 M citric acid in the bulk, attributed to the role of citric acid as a weak surfactant. Therefore, the enhanced reactivity of bromide solutions observed in the presence of citric acid is not necessarily attributable to a surface reaction but could also result from an increased solubility of ozone at higher citric acid concentrations. Whether the acid-catalyzed chemistry may have a larger effect on the surface than in the bulk to offset the effect of bromide depletion also remains open.

  7. Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layers

    NASA Astrophysics Data System (ADS)

    Greczynski, G.; Primetzhofer, D.; Lu, J.; Hultman, L.

    2017-02-01

    We present the first measurements of x-ray photoelectron spectroscopy (XPS) core level binding energies (BE:s) for the widely-applicable group IVb-VIb polycrystalline transition metal nitrides (TMN's) TiN, VN, CrN, ZrN, NbN, MoN, HfN, TaN, and WN as well as AlN and SiN, which are common components in the TMN-based alloy systems. Nitride thin film samples were grown at 400 °C by reactive dc magnetron sputtering from elemental targets in Ar/N2 atmosphere. For XPS measurements, layers are either (i) Ar+ ion-etched to remove surface oxides resulting from the air exposure during sample transfer from the growth chamber into the XPS system, or (ii) in situ capped with a few nm thick Cr or W overlayers in the deposition system prior to air-exposure and loading into the XPS instrument. Film elemental composition and phase content is thoroughly characterized with time-of-flight elastic recoil detection analysis (ToF-E ERDA), Rutherford backscattering spectrometry (RBS), and x-ray diffraction. High energy resolution core level XPS spectra acquired with monochromatic Al Kα radiation on the ISO-calibrated instrument reveal that even mild etching conditions result in the formation of a nitrogen-deficient surface layer that substantially affects the extracted binding energy values. These spectra-modifying effects of Ar+ ion bombardment increase with increasing the metal atom mass due to an increasing nitrogen-to-metal sputter yield ratio. The superior quality of the XPS spectra obtained in a non-destructive way from capped TMN films is evident from that numerous metal peaks, including Ti 2p, V 2p, Zr 3d, and Hf 4f, exhibit pronounced satellite features, in agreement with previously published spectra from layers grown and analyzed in situ. In addition, the N/metal concentration ratios are found to be 25-90% higher than those obtained from the corresponding ion-etched surfaces, and in most cases agree very well with the RBS and ToF-E ERDA values. The N 1 s BE:s extracted from

  8. X-ray photoelectron spectroscopy and structural analysis of amorphous SiO{sub x}N{sub y} films deposited at low temperatures

    SciTech Connect

    Cova, P.; Poulin, S.; Masut, R.A.

    2005-11-01

    We establish, using a tetrahedral model, the bonding properties of amorphous silicon oxynitride (a-SiO{sub x}N{sub y}) films deposited at low temperatures (LTs) by electron-cyclotron resonance chemical-vapor deposition (ECRCVD) on several substrates and under various conditions of gas flows and total gas pressure in a dilute mixture of SiH{sub 4}+N{sub 2} in Ar. The atomic percentage of each tetrahedral unit incorporated in the film network is calculated from the deconvolution of the high-resolution x-ray photoelectron spectroscopy (XPS) spectra in the Si 2p{sub 3/2} region and corroborated by the results obtained from both survey scans and the high-resolution XPS spectra in the N 1s region. The Si{sub 3}N{sub 4} phase is the most important one and the only bonding unit which is incorporated in all our LT ECRCVD SiO{sub x}N{sub y} films. The incorporation of all the other component tetrahedrons depends strongly on growth conditions. The threshold values of the N/Si atomic ratio for which intrinsic defects, such as Si-Si bonds, are not incorporated in the network depend on the O/Si ratio incorporated in the films, mainly due to the competition between oxygen and nitrogen atoms in their reaction with silicon dangling bonds. The effect of the total gas pressure on the atomic percentages of the oxidation states present in the LT ECRCVD SiO{sub x}N{sub y} films is qualitatively similar to the effect of the ion bombarding energy or the plasma density. O-N bonds are present only in samples having high amount of oxygen and nitrogen in their networks. For these films, our results show unambiguously the presence of the N-Si{sub 2}O tetrahedron and suggest that N-Si{sub 3-{nu}}O{sub {nu}} tetrahedrons with {nu}{>=}2 are not incorporated in their networks. A correlation is observed between the N-Si{sub 2}O and the Si-O{sub 3}(ON) tetrahedrons whose component peak is localized at (104.0{+-}0.2) eV in the Si 2p{sub 3/2} region of the XPS data, which suggests that both bonding

  9. Hard X-ray Standing-Wave Photoelectron Spectroscopy Study of Cobalt-Iron-Boron/Magnesium Oxide Magnetic Tunnel Junction Multilayers

    NASA Astrophysics Data System (ADS)

    Greer, Albert Anthony

    As one key aspect of the area of spin-based electronics or spintronics, the magnetic tunnel junction (MTJ) holds special promise for magnetic memory, and possibly also logic devices. In an MTJ, two ferromagnetic layers are separated by a very thin nonmagnetic insulating layer and the key effect is based on the spin-dependent tunneling of electrons through the insulating layer and is called tunnel magnetoresistance (TMR). Resistance is lower when the two ferromagnetic layers are oriented parallel to one another, and higher when they are anti-parallel. Recent work reveals that MTJs with a Ta/CoFeB/MgO/CoFeB/Ta structure show three optimal characteristics: 1) high thermal stability on the nanoscale, 2) a high TMR ratio, and 3) low switching current for current-induced switching of magnetization across the interface. Studies suggest that B diffusion from the initially amorphous CoFeB layer into the MgO causes CoFeB crystallization such that TMR-increasing perpendicular anisotropy (PMA) arises at the MgO/CoFeB interface. Furthermore, the TMR ratio is likewise regulated by B diffusion into the Ta layer. Scientists are currently exploring the structure/properties relationships of these buried interfaces in magnetic nanostructures. One effective method for probing the composition, structure, and properties of buried layers is the newly-developed technique of standing-wave, hard x-ray photoelectron spectroscopy or SW-HAXPES. In this method, a standing wave is generated by Bragg reflection from a synthetic multilayer mirror upon which the sample is deposited. This standing wave can be scanned vertically through the sample by varying the incidence angle around the Bragg angle, giving a rocking curve (RC) scan. Using SW-HAXPES, we studied the B distribution in a Ta/Co0.2Fe0.6B0.2/MgO sample. We obtained hard x-ray standing-wave data, as well as conventional variable takeoff angle XPS (angle-resolved XPS or ARXPS) data at SPring-8 in Japan, as well as complimentary soft x-ray

  10. Beam Damage of HS (CH2)15 COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-Ray Photoelectron Spectroscopy

    SciTech Connect

    Engelhard, Mark H.; Tarasevich, Barbara J.; Baer, Donald R.

    2011-10-25

    XPS spectra of HS(CH{sub 2}){sub 15} COOH terminated a self assembled monolayer (SAM)sample was collected over a period of 242 minutes to determine specimen damage during long exposures to monochromatic Al Ka x-rays. For this COOH terminated SAM we measured the loss of oxygen as a function of time by rastering a focused 100 W, 100 um diameter x-ray beam over a 1.4 mm x 0.2 mm area of the sample.

  11. Soft X-Ray and Vacuum Ultraviolet Based Spectroscopy of the Actinides

    SciTech Connect

    Tobin, J G

    2011-03-17

    The subjects of discussion included: VUV photoelectron spectroscopy, X-ray photoelectron spectroscopy, Synchrotron-radiation-based photoelectron spectroscopy, Soft x-ray absorption spectroscopy, Soft x-ray emission spectroscopy, Inverse photoelectron spectroscopy, Bremstrahlung Isochromat Spectroscopy, Low energy IPES, Resonant inverse photoelectron spectroscopy.

  12. Assigning Oxidation States to Organic Compounds via Predictions from X-Ray Photoelectron Spectroscopy: A Discussion of Approaches and Recommended Improvements

    ERIC Educational Resources Information Center

    Gupta, Vipul; Ganegoda, Hasitha; Engelhard, Mark H.; Terry, Jeff; Linford, Matthew R.

    2014-01-01

    The traditional assignment of oxidation states to organic molecules is problematic. Accordingly, in 1999, Calzaferri proposed a simple and elegant solution that is based on the similar electronegativities of carbon and hydrogen: hydrogen would be assigned an oxidation state of zero when bonded to carbon. Here, we show that X-ray photoelectron…

  13. In situ x-ray photoelectron spectroscopy and capacitance voltage characterization of plasma treatments for Al{sub 2}O{sub 3}/AlGaN/GaN stacks

    SciTech Connect

    Qin, Xiaoye; Lucero, Antonio; Azcatl, Angelica; Kim, Jiyoung; Wallace, Robert M.

    2014-07-07

    We investigate the Al{sub 2}O{sub 3}/AlGaN/GaN metal-oxide-semiconductor structure pretreated by O{sub 2} anneals, N{sub 2} remote plasma, and forming gas remote plasma prior to atomic layer deposition of Al{sub 2}O{sub 3} using in situ X-ray photoelectron spectroscopy, low energy electron diffraction, and capacitance- voltage measurements. Plasma pretreatments reduce the Ga-oxide/oxynitride formation and the interface state density, while inducing a threshold voltage instability.

  14. Correlation between Charge State of Insulating NaCl Surfaces and Ionic Mobility Induced by Water Adsorption: A Combined Ambient Pressure X-ray Photoelectron Spectroscopy and Scanning Force Microscopy Study

    SciTech Connect

    Verdaguer, Albert; Jose Segura, Juan; Fraxedas, Jordi; Bluhm, Hendrik; Salmeron, Miquel

    2008-09-03

    In situ ambient pressure X-ray photoelectron spectroscopy (APPES) and scanning force microscopy were used to characterize the surface discharge induced by water layers grown on (001) surfaces of sodium chloride single crystals. The APPES studies show that both kinetic energy (KE) and full width at half-maximum (FWHM) of the Na 2s and Cl 2p core level peaks, monitored as a function of relative humidity (RH), mimic surface conductivity curves measured using scanning force microscopy. The KE position and FWHM of the core level peaks therefore are directly related to the solvation and diffusion of ions at the NaCl(100) surface upon adsorption of water.

  15. X-ray diffraction and photoelectron spectroscopy studies of MoO 2 as catalyst for the partial oxidation of isooctane

    NASA Astrophysics Data System (ADS)

    Marin-Flores, Oscar; Scudiero, L.; Ha, Su

    2009-08-01

    X-ray diffraction (XRD), X-ray photoemission (XPS) as well as ultraviolet photoemission (UPS) spectroscopy experiments on MoO 2 powders were carried out to examine the bulk, the core level energies, and the electronic structure of MoO 2 samples that were employed as catalysts for the partial oxidation of isooctane. Five fresh 0.5-g MoO 2 samples were exposed for 0, 0.5, 9, 20, and 43 h to identical reforming environments and their spent samples were analyzed using the techniques mentioned above. Our results indicate the rapid appearance of an intermediate Mo phase with a binding energy of 228.5 eV and whose concentration progressively increases with time. The oxidation state for this new phase was graphically estimated to approximately +2.6 and assigned to the compound Mo 2O 3, which forms on the catalyst surface as a result of its exposure to the reforming environment. The electronic structure probed by UPS reveals two bands, one at 1.62 eV and another at 0.55 eV below the Fermi level, that decrease with the increasing time on stream. These results correlate very well with the drop in the catalytic performance of MoO 2 for the partial oxidation of isooctane and with the decline in the concentration of dioxide (Mo 4+) detected not only on the catalyst surface, but also in the bulk structure, as confirmed by our XRD analysis.

  16. Cosmic x ray physics

    NASA Technical Reports Server (NTRS)

    Mccammon, Dan; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

    1990-01-01

    The annual progress report on Cosmic X Ray Physics is presented. Topics studied include: the soft x ray background, proportional counter and filter calibrations, the new sounding rocket payload: X Ray Calorimeter, and theoretical studies.

  17. Cosmic x ray physics

    NASA Technical Reports Server (NTRS)

    Mccammon, Dan; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

    1991-01-01

    The annual progress report on Cosmic X Ray Physics for the period 1 Jan. to 31 Dec. 1990 is presented. Topics studied include: soft x ray background, new sounding rocket payload: x ray calorimeter, and theoretical studies.

  18. Chest X-Ray

    MedlinePlus

    ... by Image/Video Gallery Your radiologist explains chest x-ray. Transcript Welcome to Radiology Info dot org! Hello, ... you about chest radiography also known as chest x-rays. Chest x-rays are the most commonly performed ...

  19. Joint x-ray

    MedlinePlus

    X-ray - joint; Arthrography; Arthrogram ... x-ray technologist will help you position the joint to be x-rayed on the table. Once in place, pictures are taken. The joint may be moved into other positions for more ...

  20. In situ study on the thermal stability and interfaces properties of Er2O3/Al2O3/Si multi stacked films by X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Gao, Baolong; Mamat, Mamatrishat; Ghupur, Yasenjan; Ablat, Abduleziz; Ibrahim, Kurash; Wang, Jiaou; Liu, Chen; Zhao, Jiali

    2017-04-01

    Ultrathin high-k dielectric films with Er2O3/Al2O3/Si structure were fabricated by the pulsed laser deposition (PLD) technique. The samples were annealed in O2 ambient at the various temperatures. The interface reaction, and as well as the thermal stability between Si substrate and Er2O3 layer were studied in situ using X-ray photoelectron spectroscopy (XPS). The Film thickness was measured with scanning electron microscope (SEM). The experimental results indicate that the thickness of the silicate layer lessening at the interface with increasing of the thickness of Al2O3, and the production of the SiOx and the silicide is more easily formed than Er-silicate after annealing at the lower temperature because of the similarity of the structure and the small lattice mismatch.

  1. Effects of O3 and H2O oxidants on C and N-related impurities in atomic-layer-deposited La2O3 films observed by in situ x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Park, Tae Joo; Sivasubramani, Prasanna; Coss, Brian E.; Kim, Hyun-Chul; Lee, Bongki; Wallace, Robert M.; Kim, Jiyoung; Rousseau, Mike; Liu, Xinye; Li, Huazhi; Lehn, Jean-Sebastien; Hong, Daewon; Shenai, Deo

    2010-08-01

    The effect of H2O and O3 oxidants on the behavior of residual C and N-related impurities as well as Si out-diffusion and interfacial layer formation in atomic-layer-deposited La2O3 films grown at 250 °C were examined using in situ x-ray photoelectron spectroscopy. The silicate formation was suppressed in a La2O3 film grown using O3 compared to that deposited using H2O, but interfacial layer growth was enhanced. The accumulation of C and N-related residues with low binding energy, which originated from incomplete reactions, was suppressed in La2O3 films grown using O3. However, the use of O3 resulted in La-carbonate phase in film.

  2. Oxidation of Si during the growth of SiO{sub x} by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature

    SciTech Connect

    Kim, Kyung Joong; Kim, Jeong Won; Yang, Moon-Seung; Shin, Jung Hoon

    2006-10-15

    Oxidation of silicon during the growth of silicon oxide by ion beam sputter deposition was studied by in situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure at various deposition temperatures below 600 deg. C. At low temperatures, the variation of incorporated oxygen content is similar to a dissociative adsorption isotherm of O{sub 2} on Si indicating that the surface-confined reaction of the deposited Si atoms with the adsorbed oxygen atoms is the main process. However, it shows a three-step variation with the oxygen partial pressure at high temperatures. The evolution of SiO species confirmed by the XPS indicates that an adsorption-induced surface reaction and a diffusion-induced internal reaction are the main pathways for the Si oxidation.

  3. The initial oxidation of Al-Mg alloys: Depth-resolved quantitative analysis by angle-resolved x-ray photoelectron spectroscopy and real-time in situ ellipsometry

    NASA Astrophysics Data System (ADS)

    Panda, E.; Jeurgens, L. P. H.; Mittemeijer, E. J.

    2009-12-01

    Real-time in situ spectroscopic ellipsometry and in situ, angle-resolved x-ray photoelectron spectroscopy (AR-XPS) have been applied to establish the relationships between the growth kinetics and the developing microstructure of ultrathin (<3 nm) oxide films grown on clean Al-1.12 at. % Mg alloy surfaces by thermal oxidation in the temperature range T =300-485 K. To this end, procedures for the depth-resolved quantitative AR-XPS analysis of ultrathin, multiple-element, and/or multiphase oxide overgrowths on binary alloy surfaces were developed. As a result, the relationships between the relative depth distributions of Al and Mg in the developing oxide films, the oxide-film growth kinetics, and the oxidation-induced compositional changes in the AlMg alloy substrate could be established as a function of the oxidation conditions.

  4. Band slope in CdS layer of ZnO:Ga/CdS/Cu2ZnSnS4 photovoltaic cells revealed by hard X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Kataoka, Keita; Tajima, Shin; Umehara, Mitsutaro; Takahashi, Naoko; Isomura, Noritake; Kitazumi, Kosuke; Kimoto, Yasuji

    2016-11-01

    For compound semiconductor photovoltaic cells with a common structure of the window-layer (WL)/buffer-layer (BL)/absorbing-layer (AL), the band slope in BLs, affecting the conversion efficiency, was directly and non-destructively measured by hard X-ray photoelectron spectroscopy. We demonstrated that the band slope in CdS-BLs sandwiched between WLs and Cu2ZnSnS4 (CZTS)-ALs reflected the trend of the work functions of WLs ( ϕ WL ). This result implies that the larger downward band slope to the WL can be achieved using a smaller ϕ WL . The relatively large downward band slope of ˜0.5 eV to the WL was estimated in our ZnO:Ga/CdS/CZTS sample with a higher conversion efficiency of 9.4%, which indicates that the conversion efficiency of CZTS cells can be improved by a larger downward band slope to the WL.

  5. The influence of methanol on the chemical state of PtRu anodes in a high-temperature direct methanol fuel cell studied in situ by synchrotron-based near-ambient pressure x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Saveleva, Viktoriia A.; Daletou, Maria K.; Savinova, Elena R.

    2017-01-01

    Synchrotron radiation-based near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) has recently become a powerful tool for the investigation of interfacial phenomena in electrochemical power sources such as batteries and fuel cells. Here we present an in situ NAP-XPS study of the anode of a high-temperature direct methanol fuel cell with a phosphoric acid-doped hydrocarbon membrane, which reveals an enhanced flooding of the Pt3Ru anode with phosphoric acid in the presence of methanol. An analysis of the electrode surface composition depending on the cell voltage and on the presence of methanol reveals the strong influence of the latter on the extent of Pt oxidation and on the transformation of Ru into Ru (IV) hydroxide.

  6. Synchrotron radiation X-ray photoelectron spectroscopy of Ti/Al ohmic contacts to n-type GaN: Key role of Al capping layers in interface scavenging reactions

    NASA Astrophysics Data System (ADS)

    Nozaki, Mikito; Ito, Joyo; Asahara, Ryohei; Nakazawa, Satoshi; Ishida, Masahiro; Ueda, Tetsuzo; Yoshigoe, Akitaka; Hosoi, Takuji; Shimura, Takayoshi; Watanabe, Heiji

    2016-10-01

    Interface reactions between Ti-based electrodes and n-type GaN epilayers were investigated by synchrotron radiation X-ray photoelectron spectroscopy. Metallic Ga and thin TiN alloys were formed at the interface by subsequently depositing Al capping layers on ultrathin Ti layers even at room temperature. By comparing results from stacked Ti/Al and single Ti electrodes, the essential role of Al capping layers serving as an oxygen-scavenging element to produce reactive Ti underlayers was demonstrated. Further growth of the metallic interlayer during annealing was observed. A strategy for achieving low-resistance ohmic contacts to n-GaN with low-thermal-budget processing is discussed.

  7. Effect of Cl{sub 2}- and HBr-based inductively coupled plasma etching on InP surface composition analyzed using in situ x-ray photoelectron spectroscopy

    SciTech Connect

    Bouchoule, S.; Vallier, L.; Patriarche, G.; Chevolleau, T.; Cardinaud, C.

    2012-05-15

    A Cl{sub 2}-HBr-O{sub 2}/Ar inductively coupled plasma (ICP) etching process has been adapted for the processing of InP-based heterostructures in a 300-mm diameter CMOS etching tool. Smooth and anisotropic InP etching is obtained at moderate etch rate ({approx}600 nm/min). Ex situ x-ray energy dispersive analysis of the etched sidewalls shows that the etching anisotropy is obtained through a SiO{sub x} passivation mechanism. The stoichiometry of the etched surface is analyzed in situ using angle-resolved x-ray photoelectron spectroscopy. It is observed that Cl{sub 2}-based ICP etching results in a significantly P-rich surface. The phosphorous layer identified on the top surface is estimated to be {approx}1-1.3-nm thick. On the other hand InP etching in HBr/Ar plasma results in a more stoichiometric surface. In contrast to the etched sidewalls, the etched surface is free from oxides with negligible traces of silicon. Exposure to ambient air of the samples submitted to Cl{sub 2}-based chemistry results in the complete oxidation of the P-rich top layer. It is concluded that a post-etch treatment or a pure HBr plasma step may be necessary after Cl{sub 2}-based ICP etching for the recovery of the InP material.

  8. Comparative study of GeO2/Ge and SiO2/Si structures on anomalous charging of oxide films upon water adsorption revealed by ambient-pressure X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Mori, Daichi; Oka, Hiroshi; Hosoi, Takuji; Kawai, Kentaro; Morita, Mizuho; Crumlin, Ethan J.; Liu, Zhi; Watanabe, Heiji; Arima, Kenta

    2016-09-01

    The energy difference between the oxide and bulk peaks in X-ray photoelectron spectroscopy (XPS) spectra was investigated for both GeO2/Ge and SiO2/Si structures with thickness-controlled water films. This was achieved by obtaining XPS spectra at various values of relative humidity (RH) of up to ˜15%. The increase in the energy shift is more significant for thermal GeO2 on Ge than for thermal SiO2 on Si above ˜10-4% RH, which is due to the larger amount of water molecules that infiltrate into the GeO2 film to form hydroxyls. Analyzing the origins of this energy shift, we propose that the positive charging of a partially hydroxylated GeO2 film, which is unrelated to X-ray irradiation, causes the larger energy shift for GeO2/Ge than for SiO2/Si. A possible microscopic mechanism of this intrinsic positive charging is the emission of electrons from adsorbed water species in the suboxide layer of the GeO2 film to the Ge bulk, leaving immobile cations or positively charged states in the oxide. This may be related to the reported negative shift of flat band voltages in metal-oxide-semiconductor diodes with an air-exposed GeO2 layer.

  9. Effects of rare-earth substitution in the oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO by X-ray photoelectron and absorption spectroscopy

    SciTech Connect

    Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur

    2010-08-16

    X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) have been applied to examine the electronic structure of the rare-earth transition-metal oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO. Within the metal-arsenic layer [MAs], the bonding character is predominantly covalent and the As atoms are anionic, as implied by the small energy shifts in the M 2p and As 3d XPS spectra. Within the rare-earth-oxygen layer [REO], the bonding character is predominantly ionic, as implied by the similarity of the O 1s binding energies to those in highly ionic oxides. Substitution with a smaller RE element increases the O 1s binding energy, a result of an enhanced Madelung potential. The Ce 3d XPS and Ce L{sub 3}-edge XANES spectra have lineshapes and energies that confirm the presence of trivalent cerium in CeFeAsO and CeNiAsO. A population analysis of the valence band spectrum of CeNiAsO supports the formal charge assignment [Ce{sup 3+}O{sup 2-}][Ni{sup 2+}As{sup 3-}].

  10. Electron structure of excited configurations in Ca2V2O7 studied by electron-induced core-ionization loss spectroscopy, appearance-potential spectroscopy, and x-ray-photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Curelaru, I. M.; Strid, K.-G.; Suoninen, E.; Minni, E.; Rönnhult, T.

    1981-04-01

    We have measured the electron-induced core-ionization loss (CILS) spectra, the appearance-potential (APS) spectra, and the x-ray-photoelectron (XPS) spectra of Ca2V2O7, that is a prototype for a series of luminescent materials with general formula M2V2O7(M=Mg, Ca, Sr, Ba, Zn, Cd, Hg). From the analysis of the data provided by the edge spectroscopies (CILS and APS) and their comparison with the XPS binding energies, we deduced the electronic structure of the outer orbitals (occupied and empty) involved in these processes. Our data illustrate the strong many-body effects that occur in the excitation and decay of localized atomiclike configurations within the big ionic cluster V2O4-7. Excitation of core levels in calcium, outside the V2O4-7 ion, seems to involve more extended orbitals, since the screening is more efficient. Usefulness of complementary studies by x-ray emission and Auger electron spectroscopy is anticipated.

  11. Electronic structure of self-doped layered Eu3F4Bi2S4 material revealed by x-ray absorption spectroscopy and photoelectron spectromicroscopy

    NASA Astrophysics Data System (ADS)

    Paris, E.; Sugimoto, T.; Wakita, T.; Barinov, A.; Terashima, K.; Kandyba, V.; Proux, O.; Kajitani, J.; Higashinaka, R.; Matsuda, T. D.; Aoki, Y.; Yokoya, T.; Mizokawa, T.; Saini, N. L.

    2017-01-01

    We have studied the electronic structure of Eu3F4Bi2S4 using a combination of Eu L3-edge x-ray absorption spectroscopy (XAS) and space-resolved angle-resolved photoemission spectroscopy (ARPES). From the Eu L3-edge XAS, we have found that the Eu in this system is in mixed valence state with coexistence of Eu2 +/Eu3 + . The bulk charge doping was estimated to be ˜0.3 per Bi site in Eu3F4Bi2S4 , which corresponds to the nominal x in a typical REO1 -xFxBiS2 system (RE: rare-earth elements). From the space-resolved ARPES, we have ruled out the possibility of any microscale phase separation of Eu valence in the system. Using a microfocused beam we have observed the band structure as well as the Fermi surface that appeared similar to other compounds of this family with disconnected rectangular electronlike pockets around the X point. The Luttinger volume analysis gives the effective carrier to be 0.23 electrons per Bi site in Eu3F4Bi2S4 , indicating that the system is likely to be in the underdoped region of its superconducting phase diagram.

  12. Hunting liquid micro-pockets in snow and ice: Phase transition in salt solutions at the bulk and interface with X-ray photoelectron spectroscopy.

    NASA Astrophysics Data System (ADS)

    Bartels-Rausch, Thorsten; Orlando, Fabrizio; Kong, Xiangrui; Waldner, Astrid; Artiglia, Luca; Ammann, Markus; Huthwelker, Thomas

    2016-04-01

    Sea salt, and in particular chloride, is an important reactant in the atmosphere. Chloride in air-borne sea salt aerosol is - once chemically converted to a molecular halogen (Cl2, BrCl) and released to the atmosphere - well known as important atmospheric reactant, driving large-scale changes to the atmospheric composition and in particular to ozone levels in remote areas, but also in coastal mega cities. Similar chemistry has been proposed for sea salt deposits in polar snow covers. A crucial factor determining the overall reactivity is the local physical environment of the chloride ion. For example, the reactivity of liquid aerosols decreases significantly upon crystallization. Surprisingly, the phases of NaCl-containing systems are still under debate, partially due to the limited availability of in situ measurements directly probing the local environment at the surface of frozen NaCl-water binary systems. Using core electron spectroscopy of the oxygen atoms in water, we previously showed that these systems follow the phase rules at the air-ice interface. This finding contrasts some earlier observations, where the presence of liquid below the eutectic point of bulk solutions was postulated. In the present study, we present new electron yield near-edge X-ray absorption fine structure spectroscopy (NEXAFS) data obtained at near-ambient pressures up to 20 mbar of NaCl frozen solutions. The method is sensitive to small changes in the local environment of the chlorine atom. The measurements were performed at the PHOENIX beamline at SLS. The study indicates frapant differences in the phases of NaCl - water mixtures at temperatures blow the freezing point for the surface of the ice vs. the bulk. This has significant impact on modelling chemical reactions in snow or ice and it's environmental consequences.

  13. Control of the photoelectron dynamics for the effective conversion of short-pulse, frequency-modulated optical radiation into X-ray radiation

    SciTech Connect

    Silaev, A A; Meshkov, O V; Emelin, M Yu; Vvedenskii, N V; Ryabikin, M Yu

    2015-05-31

    We report a theoretical investigation of high-order harmonic generation (HHG) in the ionisation of atoms by nonlinear frequency-modulated laser pulses of short duration. It is shown that the reduction in the instantaneous value of the laser pulse frequency can lead to a significant increase in the width of the plateau in the HHG spectrum. We have found optimal parameters of frequency modulation at which photons with energies of 1 keV are efficiently generated at a relatively low laser-pulse intensity. High HHG efficiency at optimal parameters is explained by the peculiarities of atomic ionisation dynamics and acceleration of photoelectrons by a frequency-modulated laser field. (extreme light fields and their applications)

  14. Surface characterization of poly(N-isopropylacrylamide) grafted tissue culture polystyrene by electron beam irradiation, using atomic force microscopy, and X-ray photoelectron spectroscopy.

    PubMed

    Akiyama, Yoshikatsu; Kushida, Ai; Yamato, Masayuki; Kikuchi, Akihiko; Okano, Teruo

    2007-03-01

    To understand features of polymers grafted by electron beam (EB) irradiation method, we investigated topology of poly(N-isopropylacrylamide) (PIPAAm) grafted tissue culture polystyrene (TCPS) (PIPAAm-TCPS) prepared by EB irradiation, using atomic force microscopy (AFM) in air and under aqueous conditions. Furthermore, surfaces properties of PIPAAm-TCPS surfaces before and after cell culture were also examined for evaluation of functionality of the surface as biomaterials, using XPS analysis. Three types of PIPAAm-TCPSs with different graft densities (1.0+/-0.1, 1.6+/-0.1, and 2.0+/-0.1 microg/cm2 of the grafted) were obtained (abbreviated as 11PIPAAm-, 16PIPAAm-, and 20PIPAAm-TCPS) by using different initial monomer concentration (20, 55, and 65 wt%). Contact angles (costheta value) of the surfaces increased with an increase in density of the grafted polymer. AFM observation in air clearly revealed that original TCPS surface possesses scratched and grooved topology (ca. 10 nm height of the scratch), while PIPAAm-TCPSs surfaces exhibited nanoordered PIPAAm particle-like domains. The size of the particles also increased proportionally initial IPAAm monomer concentration. The 11PIPAAm-and 16PIPAAm-TCPS surfaces having ca. 10-30 nm and ca. 40-50 nm size of the particles also displayed scratched and grooved topology featured in basal TCPS. However, the larger sizes of the particles (ca. 40-100 nm) formed on 20PIPAAm-TCPS surfaces adequately conceals the topological feature of the basal TCPS surfaces. The AFM images indicate that the graft polymer is as ultra thin as the scratch and grooves featured on basal TCPS are discernible, and the grafted PIPAAm layer become thicker with an increase of the monomer concentration. For 16PIPAAm-TCPS surfaces, the nanoordered particles were also observable in aqueous conditions at 20 degrees C and 37 degrees C. Comparison between the images obtained at 20 degrees C and 37 degrees C suggest that the domains are not likely to exhibit

  15. Microgap x-ray detector

    DOEpatents

    Wuest, C.R.; Bionta, R.M.; Ables, E.

    1994-05-03

    An x-ray detector is disclosed which provides for the conversion of x-ray photons into photoelectrons and subsequent amplification of these photoelectrons through the generation of electron avalanches in a thin gas-filled region subject to a high electric potential. The detector comprises a cathode (photocathode) and an anode separated by the thin, gas-filled region. The cathode may comprise a substrate, such a beryllium, coated with a layer of high atomic number material, such as gold, while the anode can be a single conducting plane of material, such as gold, or a plane of resistive material, such as chromium/silicon monoxide, or multiple areas of conductive or resistive material, mounted on a substrate composed of glass, plastic or ceramic. The charge collected from each electron avalanche by the anode is passed through processing electronics to a point of use, such as an oscilloscope. 3 figures.

  16. Microgap x-ray detector

    DOEpatents

    Wuest, Craig R.; Bionta, Richard M.; Ables, Elden

    1994-01-01

    An x-ray detector which provides for the conversion of x-ray photons into photoelectrons and subsequent amplification of these photoelectrons through the generation of electron avalanches in a thin gas-filled region subject to a high electric potential. The detector comprises a cathode (photocathode) and an anode separated by the thin, gas-filled region. The cathode may comprise a substrate, such a beryllium, coated with a layer of high atomic number material, such as gold, while the anode can be a single conducting plane of material, such as gold, or a plane of resistive material, such as chromium/silicon monoxide, or multiple areas of conductive or resistive material, mounted on a substrate composed of glass, plastic or ceramic. The charge collected from each electron avalanche by the anode is passed through processing electronics to a point of use, such as an oscilloscope.

  17. GEMS X-ray Polarimeter Performance Simulations

    NASA Technical Reports Server (NTRS)

    Baumgartner, Wayne H.; Strohmayer, Tod; Kallman, Tim; Black, J. Kevin; Hill, Joanne; Swank, Jean

    2012-01-01

    The Gravity and Extreme Magnetism Small explorer (GEMS) is an X-ray polarization telescope selected as a NASA small explorer satellite mission. The X-ray Polarimeter on GEMS uses a Time Projection Chamber gas proportional counter to measure the polarization of astrophysical X-rays in the 2-10 keV band by sensing the direction of the track of the primary photoelectron excited by the incident X-ray. We have simulated the expected sensitivity of the polarimeter to polarized X-rays. We use the simulation package Penelope to model the physics of the interaction of the initial photoelectron with the detector gas and to determine the distribution of charge deposited in the detector volume. We then model the charge diffusion in the detector,and produce simulated track images. Within the track reconstruction algorithm we apply cuts on the track shape and focus on the initial photoelectron direction in order to maximize the overall sensitivity of the instrument, using this technique we have predicted instrument modulation factors nu(sub 100) for 100% polarized X-rays ranging from 10% to over 60% across the 2-10 keV X-ray band. We also discuss the simulation program used to develop and model some of the algorithms used for triggering, and energy measurement of events in the polarimeter.

  18. Novel Applications of X-Ray Photoelectron Spectroscopy - Controlled Differential Charging in Composite Materials and Near Ambient Pressure in-situ Studies of Catalysts Used in Exhaust Aftertreatment

    NASA Astrophysics Data System (ADS)

    Liljegren Bergman, Susanna

    XPS holds a pivotal place in surface science due to its ability to resolve chemical states at the surface level. A prominent difficulty in its application is the buildup of positive surface charge as photoelectrons are emitted from the surface during spectral acquisition. This phenomenon causes unpredictable shifts in peak shape and position in non-conducting samples that cannot be easily resolved from changes in chemical state. In this work, we explore a way to control the surface charge during XPS measurements by application of an external bias to the sample holder. Using this technique, we can resolve components of a sample not simply based on chemical identity, but also their electrical properties. The technique is applied to a composite catalyst support used in nanoplasmonic sensing, and we show how differential charging can be used to separate the nanoplasmonic disks from their silica support. We then identify a charge transfer barrier between the components and model the surface to show that the support acts as an RC element inducing a similar but delayed behavior in the disks. We also extend the application of the technique to polycrystalline and thin film materials, identifying a two-layer structure present in powders during spectral acquisition and a charge transfer barrier with dynamics on the order of 1-10 s between the layers that can be correlated with grain size. Finally, we identify differential charging in industrial grade catalysts used in exhaust aftertreatment and show how it can be corrected. We further investigate these catalysts in-situ by NAP-XPS and show that the Pt/Al 2O3 surface restructures under reaction conditions using a NOx atmosphere, causing the Pt to oxidize while the support remains inert.

  19. Bandpass x-ray diode and x-ray multiplier detector

    DOEpatents

    Wang, C.L.

    1982-09-27

    An absorption-edge of an x-ray absorption filter and a quantum jump of a photocathode determine the bandpass characteristics of an x-ray diode detector. An anode, which collects the photoelectrons emitted by the photocathode, has enhanced amplification provided by photoelectron-multiplying means which include dynodes or a microchannel-plate electron-multiplier. Suppression of undesired high frequency response for a bandpass x-ray diode is provided by subtracting a signal representative of energies above the passband from a signal representative of the overall response of the bandpass diode.

  20. X-Ray Lasers

    ERIC Educational Resources Information Center

    Chapline, George; Wood, Lowell

    1975-01-01

    Outlines the prospects of generating coherent x rays using high-power lasers and indentifies problem areas in their development. Indicates possible applications for coherent x rays in the fields of chemistry, biology, and crystallography. (GS)

  1. X-ray (image)

    MedlinePlus

    X-rays are a form of ionizing radiation that can penetrate the body to form an image on ... will be shades of gray depending on density. X-rays can provide information about obstructions, tumors, and other ...

  2. Bone x-ray

    MedlinePlus

    ... not being scanned. Alternative Names X-ray - bone Images Skeleton Skeletal spine Osteogenic sarcoma - x-ray References ... urac.org). URAC's accreditation program is an independent audit to verify that A.D.A.M. follows ...

  3. X-ray

    MedlinePlus

    ... think you might be pregnant. Alternative Names Radiography Images X-ray X-ray References Geleijns J, Tack ... urac.org). URAC's accreditation program is an independent audit to verify that A.D.A.M. follows ...

  4. Extremity x-ray

    MedlinePlus

    ... sensitive to the risks of an x-ray. Images X-ray References Kelly DM. Congenital anomalies of ... urac.org). URAC's accreditation program is an independent audit to verify that A.D.A.M. follows ...

  5. X-Ray Toolkit

    SciTech Connect

    2015-10-20

    Radiographic Image Acquisition & Processing Software for Security Markets. Used in operation of commercial x-ray scanners and manipulation of x-ray images for emergency responders including State, Local, Federal, and US Military bomb technicians and analysts.

  6. Deduction of the chemical state and the electronic structure of Nd{sub 2}Fe{sub 14}B compound from X-ray photoelectron spectroscopy core-level and valence-band spectra

    SciTech Connect

    Wang, Jing; Liang, Le; Zhang, Lanting E-mail: lmsun@sjtu.edu.cn; Sun, Limin E-mail: lmsun@sjtu.edu.cn; Hirano, Shinichi

    2014-10-28

    Characterization of chemical state and electronic structure of the technologically important Nd{sub 2}Fe{sub 14}B compound is attractive for understanding the physical nature of its excellent magnetic properties. X-ray photoelectron spectroscopy (XPS) study of such rare-earth compound is important and also challenging due to the easy oxidation of surface and small photoelectron cross-sections of rare-earth 4f electrons and B 2p electrons, etc. Here, we reported an investigation based on XPS spectra of Nd{sub 2}Fe{sub 14}B compound as a function of Ar ion sputtering time. The chemical state of Fe and that of B in Nd{sub 2}Fe{sub 14}B compound can be clearly determined to be 0 and −3, respectively. The Nd in Nd{sub 2}Fe{sub 14}B compound is found to have the chemical state of close to +3 instead of +3 as compared with the Nd in Nd{sub 2}O{sub 3}. In addition, by comparing the valence-band spectrum of Nd{sub 2}Fe{sub 14}B compound to that of the pure Fe, the contributions from Nd, Fe, and B to the valence-band structure of Nd{sub 2}Fe{sub 14}B compound is made more clear. The B 2p states and B 2s states are identified to be at ∼11.2 eV and ∼24.6 eV, respectively, which is reported for the first time. The contribution from Nd 4f states can be identified both in XPS core-level spectrum and XPS valence-band spectrum. Although Nd 4f states partially hybridize with Fe 3d states, Nd 4f states are mainly localized in Nd{sub 2}Fe{sub 14}B compound.

  7. Determination of the limit of detection by X-ray photoelectron spectroscopy for As, Zn and Pb oxides in SiO2 matrix as model systems for environmental investigations

    NASA Astrophysics Data System (ADS)

    Atzei, Davide; Elsener, Bernhard; Fantauzzi, Marzia; Brundu, Fabio; Rossi, Antonella

    2016-07-01

    In this work the detection limits of arsenic, zinc and lead in silica matrix by X-ray photoelectron spectroscopy (XPS) analysis were evaluated. These elements were selected since they are particularly relevant in environmental investigations. Pure oxides and several binary mixtures with silica at different concentrations of As (III), Zn (II) and Pb (II) oxides obtained by ball milling were analysed by XPS. Inductive-coupled plasma optical emission spectroscopy (ICP-OES) was also exploited for determining their bulk concentration. The linear response of XPS intensity vs weighed (at%) was confirmed. Three different models were here applied to estimate the limit of detection (LOD) of arsenic, zinc and lead and the results were in good agreement. Under the experimental conditions here adopted, the calculated LODs (at%) of arsenic, zinc, and lead as pure oxides and in silica matrix were found to range between 0.1 and 0.3, between 0.04 and 0.1 and between 0.03 and 0.04 respectively.

  8. In-operando hard X-ray photoelectron spectroscopy study on the impact of current compliance and switching cycles on oxygen and carbon defects in resistive switching Ti/HfO{sub 2}/TiN cells

    SciTech Connect

    Sowinska, Malgorzata Bertaud, Thomas; Walczyk, Damian; Calka, Pauline; Walczyk, Christian; Thiess, Sebastian; Alff, Lambert; Schroeder, Thomas

    2014-05-28

    In this study, direct experimental materials science evidence of the important theoretical prediction for resistive random access memory (RRAM) technologies that a critical amount of oxygen vacancies is needed to establish stable resistive switching in metal-oxide-metal samples is presented. In detail, a novel in-operando hard X-ray photoelectron spectroscopy technique is applied to non-destructively investigates the influence of the current compliance and direct current voltage sweep cycles on the Ti/HfO{sub 2} interface chemistry and physics of resistive switching Ti/HfO{sub 2}/TiN cells. These studies indeed confirm that current compliance is a critical parameter to control the amount of oxygen vacancies in the conducting filaments in the oxide layer during the RRAM cell operation to achieve stable switching. Furthermore, clear carbon segregation towards the Ti/HfO{sub 2} interface under electrical stress is visible. Since carbon impurities impact the oxygen vacancy defect population under resistive switching, this dynamic carbon segregation to the Ti/HfO{sub 2} interface is suspected to negatively influence RRAM device endurance. Therefore, these results indicate that the RRAM materials engineering needs to include all impurities in the dielectric layer in order to achieve reliable device performance.

  9. 1,2-Dimethyl-1,2-Disila-Closo-Dodecaborane(12), A silicon analog of an ortho-carborane: Synthesis; x ray crystal structure; NMR, vibrational and photoelectron spectra; bonding

    NASA Astrophysics Data System (ADS)

    Seyferth, Dietmar; Buechner, Klaus D.; Rees, William S., Jr.; Wesemann, Lars; Davis, William M.

    1993-04-01

    The reaction of (CH3)2Si(NMe2)2 with B1OH14 Yields a polymer, B1OH12 (dot) Me2NSi(CH3)2NMe2(sub n), whose pyrolysis in a stream of ammonia gives hexagonal boron nitride containing a little silicon nitride. In contrast, CH3(H)Si(NMe2)2 reacts with B1OH14 to give 1,2-dimethyl- 1,2-disila-closo- dodecaborane(12) (DMSB), an air-sensitive solid, the structure of whose 1:1 benzene solvate was determined by X-ray diffraction. This compound crystallizes in the space group P ccn (56) with a = 10.081(1) A, b = 10.666(8) A, c = 16.130(5) A, V = 1734(2) cu A, and Z = 4. The final R is equal to 0.044 and RW = 0.058. The H-1, C-13, Si-29, and B-11 NMR spectra and mass spectrum of DMSB are reported. Its vibrational spectrum (Raman, 5-3600 /cm; IR, 200-3600 /cm) was measured and compared with that of ortho-carborane. A study of its He(1) photoelectron spectrum led to the conclusion that DMSB is the most electron-rich cluster of type XYB1OH1O with two adjacent main group element centers known.

  10. Investigation on the interfacial chemical state and band alignment for the sputtering-deposited CaF2/p-GaN heterojunction by angle-resolved X-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Zhang, Kexiong; Liao, Meiyong; Sumiya, Masatomo; Koide, Yasuo; Sang, Liwen

    2016-11-01

    The interfacial chemical state and the band alignment of the sputtering-deposited CaF2/p-GaN hetero-structure were investigated by angle-resolved X-ray photoelectron spectroscopy. The dependence of Ga 3p core-level positions on the collection angles proves that the downward band bending of p-GaN is reduced from 1.51 to 0.85 eV after the deposition of CaF2, which may be due to the reduction of Mg-Ga-O-related interface states by the oxygen-free deposition of CaF2. The band gap of sputtering-deposited CaF2 is estimated to be about 7.97 eV with a potential gradient of 0.48 eV obtained by the variation of the Ca 2p3/2 position on different collection angles. By taking into account the p-GaN surface band bending and potential gradient in the CaF2 layer, large valence and conduction band offsets of 2.66 ± 0.20 and 1.92 ± 0.20 eV between CaF2 and p-GaN are obtained. These results indicate that CaF2 is a promising gate dielectric layer on the p-GaN for the application of metal-insulator-semiconductor devices.

  11. Band alignment of HfO{sub 2}/multilayer MoS{sub 2} interface determined by x-ray photoelectron spectroscopy: Effect of CHF{sub 3} treatment

    SciTech Connect

    Liu, Xinke; He, Jiazhu; Tang, Dan; Jia, Fang; Lu, Youming Zhu, Deliang; Liu, Wenjun; Cao, Peijiang; Han, Sun; Liu, Qiang; Wen, Jiao; Yu, Wenjie; Pan, Jisheng; He, Zhubing; Ang, Kah-Wee

    2015-09-07

    The energy band alignment between HfO{sub 2}/multilayer (ML)-MoS{sub 2} was characterized using high-resolution x-ray photoelectron spectroscopy. The HfO{sub 2} was deposited using an atomic layer deposition tool, and ML-MoS{sub 2} was grown by chemical vapor deposition. A valence band offset (VBO) of 1.98 eV and a conduction band offset (CBO) of 2.72 eV were obtained for the HfO{sub 2}/ML-MoS{sub 2} interface without any treatment. With CHF{sub 3} plasma treatment, a VBO and a CBO across the HfO{sub 2}/ML-MoS{sub 2} interface were found to be 2.47 eV and 2.23 eV, respectively. The band alignment difference is believed to be dominated by the down-shift in the core level of Hf 4d and up-shift in the core level of Mo 3d, or the interface dipoles, which caused by the interfacial layer in rich of F.

  12. Investigation of fluorine in SiO2 and on Si surface by the 19F(p,αγ)16O reaction, secondary-ion mass spectrometry, and x-ray photoelectron spectroscopy

    NASA Astrophysics Data System (ADS)

    Yu, Byoung-gon; Arai, Eiichi; Nishioka, Yasushiro; Ohji, Yuzuru; Iwata, Seiichi; Ma, T. P.

    1990-04-01

    A fluorinated thermal SiO2, grown after HF surface treatment without de-ionized water rinse, was estimated to contain ˜3×1013 cm-2 of fluorine by the 19F(p,αγ)16O reaction. Secondary-ion mass spectrometry data indicate that the SiF distribution is peaked at the SiO2/Si interface in the fluorinated oxide. The time-dependent change of the absolute amount of fluorine on the HF-treated silicon surface as a function of storage time in air or in vacuum was also investigated by the 19F(p,αγ)16O reaction. The initial number of fluorine atoms on the HF-treated silicon surface was estimated to be ˜1015 cm-2 before substantial desorption took place. Fluorine atoms desorb from the silicon surface much more rapidly if the sample is stored in air than in vacuum. These results were also supported by the x-ray photoelectron spectroscopy measurement.

  13. Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

    SciTech Connect

    Cumpson, Peter J.; Portoles, Jose F.; Barlow, Anders J.; Sano, Naoko

    2013-09-28

    Argon Gas Cluster-Ion Beam sources are likely to become widely used on x-ray photoelectron spectroscopy and secondary ion mass spectrometry instruments in the next few years. At typical energies used for sputter depth profiling the average argon atom in the cluster has a kinetic energy comparable with the sputter threshold, meaning that for the first time in practical surface analysis a quantitative model of sputter yields near threshold is needed. We develop a simple equation based on a very simple model. Though greatly simplified it is likely to have realistic limiting behaviour and can be made useful for estimating sputter yields by fitting its three parameters to experimental data. We measure argon cluster-ion sputter yield using a quartz crystal microbalance close to the sputter threshold, for silicon dioxide, poly(methyl methacrylate), and polystyrene and (along with data for gold from the existing literature) perform least-squares fits of our new sputter yield equation to this data. The equation performs well, with smaller residuals than for earlier empirical models, but more importantly it is very easy to use in the design and quantification of sputter depth-profiling experiments.

  14. Surface characterization of three marine bacterial strains by Fourier transform IR, X-ray photoelectron spectroscopy, and time-of-flight secondary-ion mass spectrometry, correlation with adhesion on stainless steel surfaces.

    PubMed

    Pradier, C M; Rubio, C; Poleunis, C; Bertrand, P; Marcus, P; Compère, C

    2005-05-19

    Adhesion of bacterial strains on solid substrates is likely related to the properties of the outer shell of the micro-organisms. Aiming at a better understanding and control of the biofilm formation in seawater, the surface chemical composition of three marine bacterial strains was investigated by combining Fourier transform IR spectroscopy, X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary-ion mass spectrometry (ToF-SIMS). The D41 strain surface showed evidence of proteins, as deduced from the NH2 and NCO XPS and ToF-SIMS fingerprints; this strain was found to adhere to stainless steel, glass, or Teflon surfaces in a much higher quantity (2 orders of magnitude) than the two other ones, DA and D01. The latter are either enriched in COOH or sulfates, and this makes them more hydrophilic and less adherent to all substrates. Correlations with physicochemical properties and adhesion seem to demonstrate the role of the external layer composition, in particular the role of proteins more than that of hydrophobicity, on their adhesion abilities.

  15. Photoyield and x-ray-photoelectron spectroscopic studies of O2-annealing effects on SrBi2Ta2O9 thin films prepared by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Takahashi, M.; Noda, M.; Okuyama, M.

    2003-08-01

    Electronic properties of various SrBi2Ta2O9 (SBT) thin films were studied by ultraviolet (UV)-ray photoyield spectroscopy (PYS) and x-ray photoelectron spectroscopy (XPS). The UV-PYS studies have shown that O2 annealing increases the Fermi level in the SBT thin film surface which was prepared by pulsed laser deposition (PLD) by about 0.34 eV, while the other SBT thin films deposited by metalorganic decomposition (MOD) have shown almost the same Fermi levels as the O2-annealed PLD-SBT thin film. The XPS studies of those SBT thin films have shown that the PLD-SBT thin film is more susceptible to deoxidization by Ar+ bombardment than MOD-SBT thin films. This implies that the PLD-SBT thin film includes more defective (Bi2O2)2+ layers than MOD-SBT thin films. The O2-annealing effects on the PLD-SBT thin films are thought to oxidize defective (Bi2O2)2+ layers on the PLD-SBT surface and to shift the surface Fermi level towards the center of the band gap.

  16. Detecting Carbon in Carbon: Exploiting Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy

    PubMed Central

    Gorham, Justin M.; Osborn, William A.; Woodcock, Jeremiah W.; Scott, Keana C. K.; Heddleston, John M.; Walker, Angela R. Hight; Gilman, Jeffrey W

    2016-01-01

    To better assess risks associated with nano-enabled products including multiwalled carbon nanotubes (MWCNT) within polymer matrices, it is important to understand how MWCNT are dispersed throughout the composite. The current study presents a method which employs imaging X-ray photoelectron spectroscopy (XPS) to chemically detect spatially segregated MWCNT rich regions at an epoxy composites surface by exploiting differential charging. MWCNT do not charge due to high conductivity and have previously been shown to energetically separate from their insulating surroundings when characterized by XPS. XPS in imaging mode revealed that these conductive regions were spatially separated due to micrometer-scale MWCNT aggregation and poor dispersion during the formation of the composite. Three MWCNT concentrations were studied; (1, 4 and 5) % by mass MWCNT within an epoxy matrix. Images acquired in periodic energy intervals were processed using custom algorithms designed to efficiently extract spectra from regions of interest. As a result, chemical and electrical information on aggregate and non-aggregate portions of the composite was extracted. Raman imaging and scanning electron microscopy were employed as orthogonal techniques for validating this XPS-based methodology. Results demonstrate that XPS imaging of differentially charging MWCNT composite samples is an effective means for assessing dispersion quality. PMID:27765956

  17. Electronic structure of (Ge{sub 2}Sb{sub 2}Te{sub 5}){sub 1-x}(In{sub 3}SbTe{sub 2}){sub x} investigated by x-ray photoelectron spectroscopy

    SciTech Connect

    Benayad, Anass; Kim, Kihong; Lee, JaeCheol; Kang, YounSeon; Suh, Dong-Seok; Kim, KiJoon; Kim, CheolKyu; Lee, Tae-Yon; Noh, Jin-Seo; Khang, YoonHo; Shin, Hyun-Joon

    2009-08-15

    We have investigated the core levels and the valence band of (Ge{sub 2}Sb{sub 2}Te{sub 5}){sub 1-x}(In{sub 3}Sb{sub 1}Te{sub 2}){sub x} quaternary phase system (IGST) by means of x-ray photoelectron spectroscopy. A systematic shift of Sb 3d and Ge 2p core-level peaks toward lower binding energies side was observed with increasing indium amount, whereas the In 3d and Te 3d core peaks showed less change. The Sb 3d and Ge 2p core-level shift is attributed to an increase in the electronic charge of p-electrons dependent of indium amount. The valence band spectra show a distinct change in the sp configuration with indium concentration change. The change in the local bonding as the indium amount increase has a profound impact on both local atomic arrangement and amorphous-to-crystalline transformation temperature. The difference in the photoemission spectra have been discussed according to a simple structural model suggesting that the Na site in IGST can be occupied by Te, Sb, In, and vacancy, whereas in GST it is occupied only by Te.

  18. In-operando hard X-ray photoelectron spectroscopy study on the impact of current compliance and switching cycles on oxygen and carbon defects in resistive switching Ti/HfO2/TiN cells

    NASA Astrophysics Data System (ADS)

    Sowinska, Malgorzata; Bertaud, Thomas; Walczyk, Damian; Thiess, Sebastian; Calka, Pauline; Alff, Lambert; Walczyk, Christian; Schroeder, Thomas

    2014-05-01

    In this study, direct experimental materials science evidence of the important theoretical prediction for resistive random access memory (RRAM) technologies that a critical amount of oxygen vacancies is needed to establish stable resistive switching in metal-oxide-metal samples is presented. In detail, a novel in-operando hard X-ray photoelectron spectroscopy technique is applied to non-destructively investigates the influence of the current compliance and direct current voltage sweep cycles on the Ti/HfO2 interface chemistry and physics of resistive switching Ti/HfO2/TiN cells. These studies indeed confirm that current compliance is a critical parameter to control the amount of oxygen vacancies in the conducting filaments in the oxide layer during the RRAM cell operation to achieve stable switching. Furthermore, clear carbon segregation towards the Ti/HfO2 interface under electrical stress is visible. Since carbon impurities impact the oxygen vacancy defect population under resistive switching, this dynamic carbon segregation to the Ti/HfO2 interface is suspected to negatively influence RRAM device endurance. Therefore, these results indicate that the RRAM materials engineering needs to include all impurities in the dielectric layer in order to achieve reliable device performance.

  19. Sinus x-ray

    MedlinePlus

    Paranasal sinus radiography; X-ray - sinuses ... sinus x-ray is taken in a hospital radiology department. Or the x-ray may be taken ... Brown J, Rout J. ENT, neck, and dental radiology. In: Adam A, Dixon AK, Gillard JH Schaefer- ...

  20. Hand x-ray

    MedlinePlus

    X-ray - hand ... A hand x-ray is taken in a hospital radiology department or your health care provider's office by an ... technician. You will be asked to place your hand on the x-ray table, and keep it ...

  1. Electronic structure of the (Nd{sub 1−x}Dy{sub x}){sub 2}Fe{sub 14}B (0 ≤ x ≤ 1) system studied by X-ray photoelectron spectroscopy

    SciTech Connect

    Wang, Jing; Liang, Le; Yang, Bin; Sun, Li-min; Zhang, Lan-ting; Hirano, Shin-ichi

    2015-09-15

    Systematic characterization of electronic structures in the (Nd{sub 1−x}Dy{sub x}){sub 2}Fe{sub 14}B system, especially the 4f behavior, provides an insight to the physical nature of the evolution of magnetic properties. A series of X-ray photoelectron spectroscopy (XPS) core-level and valence-band spectra were used to study the electronic structures. It was found that substitution of Dy for Nd in Nd{sub 2}Fe{sub 14}B results in a nonlinear variation in the evolution of electronic structures. Only the finite coupling between the Nd 4f states and the Fe 3d states is found at both the Nd-rich regime and the Dy-rich regime. When the Dy concentration and the Nd concentration approach to be equal, a strong coupling between the Nd 4f states and the Fe 3d states is found, which results in a bonding state between them. Additionally, the 4f components in the (Nd{sub 1−x}Dy{sub x}){sub 2}Fe{sub 14}B system are ascribed to three parts: 1) the individual contribution of the Dy 4f states, which emerges just after the Dy-substitution; 2) the contribution of the coupling between the Nd 4f states and the Dy 4f states, which arises only when 0.4 ≤ x ≤ 0.6; 3) the associated contributions of the Nd 4f states and the Dy 4f states, where the contribution of the Nd 4f states and that of the Dy 4f states are prominent in the Nd-rich regime and Dy-rich regime, respectively.

  2. Growth of an Ultrathin Zirconia Film on Pt3Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory

    PubMed Central

    2014-01-01

    Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt3Zr(0001) substrate by oxidation in 1 × 10–7 mbar of O2 at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO2 films are intended to serve as model supports for reforming catalysts and fuel cell anodes. The atomic and electronic structure and composition of the ZrO2 films were determined by synchrotron-based high-resolution X-ray photoelectron spectroscopy (HR-XPS) (including depth profiling), low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and density functional theory (DFT) calculations. Oxidation mainly leads to ultrathin trilayer (O–Zr–O) films on the alloy; only a small area fraction (10–15%) is covered by ZrO2 clusters (thickness ∼0.5–10 nm). The amount of clusters decreases with increasing annealing temperature. Temperature-programmed desorption (TPD) of CO was utilized to confirm complete coverage of the Pt3Zr substrate by ZrO2, that is, formation of a closed oxide overlayer. Experiments and DFT calculations show that the core level shifts of Zr in the trilayer ZrO2 films are between those of metallic Zr and thick (bulklike) ZrO2. Therefore, the assignment of such XPS core level shifts to substoichiometric ZrOx is not necessarily correct, because these XPS signals may equally well arise from ultrathin ZrO2 films or metal/ZrO2 interfaces. Furthermore, our results indicate that the common approach of calculating core level shifts by DFT including final-state effects should be taken with care for thicker insulating films, clusters, and bulk insulators. PMID:25688293

  3. Growth of an Ultrathin Zirconia Film on Pt3Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory.

    PubMed

    Li, Hao; Choi, Joong-Il Jake; Mayr-Schmölzer, Wernfried; Weilach, Christian; Rameshan, Christoph; Mittendorfer, Florian; Redinger, Josef; Schmid, Michael; Rupprechter, Günther

    2015-02-05

    Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt3Zr(0001) substrate by oxidation in 1 × 10(-7) mbar of O2 at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO2 films are intended to serve as model supports for reforming catalysts and fuel cell anodes. The atomic and electronic structure and composition of the ZrO2 films were determined by synchrotron-based high-resolution X-ray photoelectron spectroscopy (HR-XPS) (including depth profiling), low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and density functional theory (DFT) calculations. Oxidation mainly leads to ultrathin trilayer (O-Zr-O) films on the alloy; only a small area fraction (10-15%) is covered by ZrO2 clusters (thickness ∼0.5-10 nm). The amount of clusters decreases with increasing annealing temperature. Temperature-programmed desorption (TPD) of CO was utilized to confirm complete coverage of the Pt3Zr substrate by ZrO2, that is, formation of a closed oxide overlayer. Experiments and DFT calculations show that the core level shifts of Zr in the trilayer ZrO2 films are between those of metallic Zr and thick (bulklike) ZrO2. Therefore, the assignment of such XPS core level shifts to substoichiometric ZrO x is not necessarily correct, because these XPS signals may equally well arise from ultrathin ZrO2 films or metal/ZrO2 interfaces. Furthermore, our results indicate that the common approach of calculating core level shifts by DFT including final-state effects should be taken with care for thicker insulating films, clusters, and bulk insulators.

  4. X-ray photoelectron spectroscopy study of the skutterudites LaFe4Sb12 , CeFe4Sb12 , CoSb3 , and CoP3

    NASA Astrophysics Data System (ADS)

    Grosvenor, Andrew P.; Cavell, Ronald G.; Mar, Arthur

    2006-09-01

    The electronic structure of the skutterudites CoSb3 , CoP3 , LaFe4Sb12 , and CeFe4Sb12 has been investigated with x-ray photoelectron spectroscopy. The binding energies in the pnicogen and transition metal 2p spectra are shifted to reflect changes in the bonding character of these compounds. The asymmetric line shapes in the metal 2p spectra signal electronic delocalization. A plasmon loss satellite peak occurs in the Co 2p spectra of CoSb3 and CoP3 . The intensity of this peak in these and other Co-containing compounds increases with greater occupancy of the Co 3d band. The presence of trivalent rare earth was confirmed from the La and Ce 3d spectra, both of which contain shake-up satellite peaks. A second satellite peak, attributable to two-core-hole processes, also appears in the La 3d spectrum of LaFe4Sb12 but not in LaFe4P12 , indicating the involvement of La-Sb covalent bonding and the population of La 4f conduction states in the former. This peak is absent in the Ce 3d spectrum of CeFe4Sb12 because a 4f1 state is located below the Fermi edge. Fitting of the valence band spectra for all four compounds led to the formulations (Co3+)(Pn1-)3 and (R3+)(Fe2+)4(Sb1-)12 , with the electron deficiency in the rare-earth containing compounds being represented by a hole in the valence band.

  5. X-ray binaries

    NASA Technical Reports Server (NTRS)

    1976-01-01

    Satellite X-ray experiments and ground-based programs aimed at observation of X-ray binaries are discussed. Experiments aboard OAO-3, OSO-8, Ariel 5, Uhuru, and Skylab are included along with rocket and ground-based observations. Major topics covered are: Her X-1, Cyg X-3, Cen X-3, Cyg X-1, the transient source A0620-00, other possible X-ray binaries, and plans and prospects for future observational programs.

  6. X-ray induced optical reflectivity

    NASA Astrophysics Data System (ADS)

    Durbin, Stephen M.

    2012-12-01

    The change in optical reflectivity induced by intense x-ray pulses can now be used to study ultrafast many body responses in solids in the femtosecond time domain. X-ray absorption creates photoelectrons and core level holes subsequently filled by Auger or fluorescence processes, and these excitations ultimately add conduction and valence band carriers that perturb optical reflectivity. Optical absorption associated with band filling and band gap narrowing is shown to explain the basic features found in recent measurements on an insulator (silicon nitride, Si3N4), a semiconductor (gallium arsenide, GaAs), and a metal (gold, Au), obtained with ˜100 fs x-ray pulses at 500-2000 eV and probed with 800 nm laser pulses. In particular GaAs exhibits an abrupt drop in reflectivity, persisting only for a time comparable to the x-ray excitation pulse duration, consistent with prompt band gap narrowing.

  7. X-Ray

    MedlinePlus

    ... of gray. For some types of X-ray tests, a contrast medium — such as iodine or barium — is introduced into your body to provide greater detail on the images. X-ray technology is used to examine many parts of the ...

  8. Chest X-Ray

    MedlinePlus Videos and Cool Tools

    ... Site Index A-Z Spotlight Recently posted: Anal Cancer Facet Joint Block Video: Lung Cancer Screening Video: Upper GI Tract X-ray Video: ... of lung conditions such as pneumonia, emphysema and cancer. A chest x-ray requires no special preparation. ...

  9. X-ray Spectrometry.

    ERIC Educational Resources Information Center

    Markowicz, Andrzej A.; Van Grieken, Rene E.

    1984-01-01

    Provided is a selective literature survey of X-ray spectrometry from late 1981 to late 1983. Literature examined focuses on: excitation (photon and electron excitation and particle-induced X-ray emission; detection (wavelength-dispersive and energy-dispersive spectrometry); instrumentation and techniques; and on such quantitative analytical…

  10. X-ray beamsplitter

    DOEpatents

    Ceglio, Natale M.; Stearns, Daniel S.; Hawryluk, Andrew M.; Barbee, Jr., Troy W.

    1989-01-01

    An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5-50 pairs of alternate Mo/Si layers with a period of 20-250 A. The support membrane is 10-200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window.

  11. Dental x-rays

    MedlinePlus

    ... X-rays are a form of high energy electromagnetic radiation. The x-rays penetrate the body to form ... for detecting cavities, unless the decay is very advanced and deep. Many ... The amount of radiation given off during the procedure is less than ...

  12. X-ray beamsplitter

    DOEpatents

    Ceglio, N.M.; Stearns, D.G.; Hawryluk, A.M.; Barbee, T.W. Jr.

    1987-08-07

    An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5--50 pairs of alternate Mo/Si layers with a period of 20--250 A. The support membrane is 10--200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window. 6 figs.

  13. X-ray generator

    DOEpatents

    Dawson, John M.

    1976-01-01

    Apparatus and method for producing coherent secondary x-rays that are controlled as to direction by illuminating a mixture of high z and low z gases with an intense burst of primary x-rays. The primary x-rays are produced with a laser activated plasma, and these x-rays strip off the electrons of the high z atoms in the lasing medium, while the low z atoms retain their electrons. The neutral atoms transfer electrons to highly excited states of the highly striped high z ions giving an inverted population which produces the desired coherent x-rays. In one embodiment, a laser, light beam provides a laser spark that produces the intense burst of coherent x-rays that illuminates the mixture of high z and low z gases, whereby the high z atoms are stripped while the low z ones are not, giving the desired mixture of highly ionized and neutral atoms. To this end, the laser spark is produced by injecting a laser light beam, or a plurality of beams, into a first gas in a cylindrical container having an adjacent second gas layer co-axial therewith, the laser producing a plasma and the intense primary x-rays in the first gas, and the second gas containing the high and low atomic number elements for receiving the primary x-rays, whereupon the secondary x-rays are produced therein by stripping desired ions in a neutral gas and transfer of electrons to highly excited states of the stripped ions from the unionized atoms. Means for magnetically confining and stabilizing the plasma are disclosed for controlling the direction of the x-rays.

  14. X-ray crystallography

    NASA Technical Reports Server (NTRS)

    2001-01-01

    X-rays diffracted from a well-ordered protein crystal create sharp patterns of scattered light on film. A computer can use these patterns to generate a model of a protein molecule. To analyze the selected crystal, an X-ray crystallographer shines X-rays through the crystal. Unlike a single dental X-ray, which produces a shadow image of a tooth, these X-rays have to be taken many times from different angles to produce a pattern from the scattered light, a map of the intensity of the X-rays after they diffract through the crystal. The X-rays bounce off the electron clouds that form the outer structure of each atom. A flawed crystal will yield a blurry pattern; a well-ordered protein crystal yields a series of sharp diffraction patterns. From these patterns, researchers build an electron density map. With powerful computers and a lot of calculations, scientists can use the electron density patterns to determine the structure of the protein and make a computer-generated model of the structure. The models let researchers improve their understanding of how the protein functions. They also allow scientists to look for receptor sites and active areas that control a protein's function and role in the progress of diseases. From there, pharmaceutical researchers can design molecules that fit the active site, much like a key and lock, so that the protein is locked without affecting the rest of the body. This is called structure-based drug design.

  15. X-ray laser

    DOEpatents

    Nilsen, Joseph

    1991-01-01

    An X-ray laser (10) that lases between the K edges of carbon and oxygen, i.e. between 44 and 23 Angstroms, is provided. The laser comprises a silicon (12) and dysprosium (14) foil combination (16) that is driven by two beams (18, 20) of intense line focused (22, 24) optical laser radiation. Ground state nickel-like dysprosium ions (34) are resonantly photo-pumped to their upper X-ray laser state by line emission from hydrogen-like silicon ions (32). The novel X-ray laser should prove especially useful for the microscopy of biological specimens.

  16. X-ray superbubbles

    NASA Technical Reports Server (NTRS)

    Cash, W.

    1983-01-01

    Four regions of the galaxy, the Cygnus Superbubble, the Eta Carina complex, the Orion/Eridanus complex, and the Gum Nebula, are discussed as examples of collective effects in the interstellar medium. All four regions share certain features, indicating a common structure. The selection effects which determine the observable X-ray properties of the superbubbles are discussed, and it is demonstrated that only a very few more in our Galaxy can be detected in X rays. X-ray observation of extragalactic superbubbles is shown to be possible but requires the capabilities of a large, high quality, AXAF class observatory.

  17. Lumbosacral spine x-ray

    MedlinePlus

    X-ray - lumbosacral spine; X-ray - lower spine ... The test is done in a hospital x-ray department or your health care provider's office by an x-ray technician. You will be asked to lie on the x-ray table ...

  18. Thoracic spine x-ray

    MedlinePlus

    Vertebral radiography; X-ray - spine; Thoracic x-ray; Spine x-ray; Thoracic spine films; Back films ... The test is done in a hospital radiology department or in the health care provider's office. You will lie on the x-ray table in different positions. If the x-ray ...

  19. Detecting X-rays with an optical imaging chamber

    NASA Astrophysics Data System (ADS)

    Austin, Robert A.; Ramsey, Brian D.

    1992-10-01

    The light emitted by electron avalanches in a parallel plate chamber can be used to image the tracks of photoelectrons liberated by the interaction of an incident X-ray with the gas filling the chamber. The different morphologies of photoelectron tracks and minimum ionizing tracks can be used for charged particle rejection. The initial direction (before scattering) of the liberated photoelectron also contains information about the polarization of the incident radiation. We have built a small test chamber with which we have imaged photoelectron tracks using an intensified CCD camera. Our results show that optical imaging could be used in a hard X-ray imaging polarimeter useful for astronomy.

  20. X-ray - skeleton

    MedlinePlus

    ... medlineplus.gov/ency/article/003381.htm X-ray - skeleton To use the sharing features on this page, ... ray views may be uncomfortable. If the whole skeleton is being imaged, the test usually takes 1 ...

  1. Cosmic x ray physics

    NASA Technical Reports Server (NTRS)

    Mccammon, Dan; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

    1992-01-01

    This final report covers the period 1 January 1985 - 31 March 1992. It is divided into the following sections: the soft x-ray background; proportional counter and filter calibrations; sounding rocket flight preparations; new sounding rocket payload: x-ray calorimeter; and theoretical studies. Staff, publications, conference proceedings, invited talks, contributed talks, colloquia and seminars, public service lectures, and Ph. D. theses are listed.

  2. X-ray Binaries

    NASA Astrophysics Data System (ADS)

    Lewin, Walter H. G.; van Paradijs, Jan; van den Heuvel, Edward Peter Jacobus

    1997-01-01

    Preface; 1. The properties of X-ray binaries, N. E. White, F. Nagase and A. N. Parmar; 2. Optical and ultraviolet observations of X-ray binaries J. van Paradijs and J. E. McClintock; 3. Black-hole binaries Y. Tanaka and W. H. G. Lewin; 4. X-ray bursts Walter H. G. Lewin, Jan Van Paradijs and Ronald E. Taam; 5. Millisecond pulsars D. Bhattacharya; 6. Rapid aperiodic variability in binaries M. van der Klis; 7. Radio properties of X-ray binaries R. M. Hjellming and X. Han; 8. Cataclysmic variable stars France Anne-Dominic Córdova; 9. Normal galaxies and their X-ray binary populations G. Fabbiano; 10. Accretion in close binaries Andrew King; 11. Formation and evolution of neutron stars and black holes in binaries F. Verbunt and E. P. J. van den Heuvel; 12. The magnetic fields of neutron stars and their evolution D. Bhattacharya and G. Srinivasan; 13. Cosmic gamma-ray bursts K. Hurley; 14. A catalogue of X-ray binaries Jan van Paradijs; 15. A compilation of cataclysmic binaries with known or suspected orbital periods Hans Ritter and Ulrich Kolb; References; Index.

  3. In situ synchrotron based x-ray techniques as monitoring tools for atomic layer deposition

    SciTech Connect

    Devloo-Casier, Kilian Detavernier, Christophe; Dendooven, Jolien

    2014-01-15

    Atomic layer deposition (ALD) is a thin film deposition technique that has been studied with a variety of in situ techniques. By exploiting the high photon flux and energy tunability of synchrotron based x-rays, a variety of new in situ techniques become available. X-ray reflectivity, grazing incidence small angle x-ray scattering, x-ray diffraction, x-ray fluorescence, x-ray absorption spectroscopy, and x-ray photoelectron spectroscopy are reviewed as possible in situ techniques during ALD. All these techniques are especially sensitive to changes on the (sub-)nanometer scale, allowing a unique insight into different aspects of the ALD growth mechanisms.

  4. Clocking femtosecond X rays.

    PubMed

    Cavalieri, A L; Fritz, D M; Lee, S H; Bucksbaum, P H; Reis, D A; Rudati, J; Mills, D M; Fuoss, P H; Stephenson, G B; Kao, C C; Siddons, D P; Lowney, D P; Macphee, A G; Weinstein, D; Falcone, R W; Pahl, R; Als-Nielsen, J; Blome, C; Düsterer, S; Ischebeck, R; Schlarb, H; Schulte-Schrepping, H; Tschentscher, Th; Schneider, J; Hignette, O; Sette, F; Sokolowski-Tinten, K; Chapman, H N; Lee, R W; Hansen, T N; Synnergren, O; Larsson, J; Techert, S; Sheppard, J; Wark, J S; Bergh, M; Caleman, C; Huldt, G; van der Spoel, D; Timneanu, N; Hajdu, J; Akre, R A; Bong, E; Emma, P; Krejcik, P; Arthur, J; Brennan, S; Gaffney, K J; Lindenberg, A M; Luening, K; Hastings, J B

    2005-03-25

    Linear-accelerator-based sources will revolutionize ultrafast x-ray science due to their unprecedented brightness and short pulse duration. However, time-resolved studies at the resolution of the x-ray pulse duration are hampered by the inability to precisely synchronize an external laser to the accelerator. At the Sub-Picosecond Pulse Source at the Stanford Linear-Accelerator Center we solved this problem by measuring the arrival time of each high energy electron bunch with electro-optic sampling. This measurement indirectly determined the arrival time of each x-ray pulse relative to an external pump laser pulse with a time resolution of better than 60 fs rms.

  5. X-ray fluorescence experiment

    NASA Technical Reports Server (NTRS)

    Adler, I.; Trombka, J. I.; Gerard, J.; Schmadebeck, R.; Lowman, P.; Blodgett, H.; Yin, L.; Eller, E.; Lamothe, R.; Gorenstein, P.

    1972-01-01

    The preliminary results from the Sco X-1 and Cyg X-1 obtained from the Apollo 15 X-ray detector data are presented along with preliminary results of the X-ray fluorescence spectrometric data of the lunar surface composition. The production of the characteristic X-rays following the interaction of solar X-rays with the lunar surface is described along with the X-ray spectrometer. Preliminary analyses of the astronomical X-ray observation and the X-ray fluorescence data are presented.

  6. Composition and growth behavior of the surface and electrolyte decomposition layer of/on a commercial lithium ion battery LixNi1/3Mn1/3Co1/3O2 cathode determined by sputter depth profile X-ray photoelectron spectroscopy.

    PubMed

    Niehoff, Philip; Winter, Martin

    2013-12-23

    A detailed X-ray photoelectron spectroscopy (XPS) study of the surface and electrolyte decomposition layer of a LixNi1/3Mn1/3Co1/3O2 (NMC) cathode from commercial NMC/graphite cells by intense sputter depth profiling (SDP) using a polyatomic ion gun is provided. Cathodes of a cell after electrochemical formation and a cell at a state of initial capacity (SOIC) of 80%, which was reached after 2500 full cycles at 30 °C, are investigated.

  7. X-ray beam finder

    DOEpatents

    Gilbert, H.W.

    1983-06-16

    An X-ray beam finder for locating a focal spot of an X-ray tube includes a mass of X-ray opaque material having first and second axially-aligned, parallel-opposed faces connected by a plurality of substantially identical parallel holes perpendicular to the faces and a film holder for holding X-ray sensitive film tightly against one face while the other face is placed in contact with the window of an X-ray head.

  8. Neck x-ray

    MedlinePlus

    ... look at cervical vertebrae. These are the 7 bones of the spine in the neck. ... A neck x-ray can detect: Bone joint that is out of position (dislocation) Breathing in a foreign object Broken bone (fracture) Disk problems (disks ...

  9. Abdominal x-ray

    MedlinePlus

    ... a kidney stone Identify blockage in the intestine Locate an object that has been swallowed Help diagnose diseases, such as tumors or other conditions Normal Results The x-ray will show normal structures for a person your age. What Abnormal Results Mean Abnormal findings ...

  10. X-Ray Astronomy

    NASA Technical Reports Server (NTRS)

    Wu, S. T.

    2000-01-01

    Dr. S. N. Zhang has lead a seven member group (Dr. Yuxin Feng, Mr. XuejunSun, Mr. Yongzhong Chen, Mr. Jun Lin, Mr. Yangsen Yao, and Ms. Xiaoling Zhang). This group has carried out the following activities: continued data analysis from space astrophysical missions CGRO, RXTE, ASCA and Chandra. Significant scientific results have been produced as results of their work. They discovered the three-layered accretion disk structure around black holes in X-ray binaries; their paper on this discovery is to appear in the prestigious Science magazine. They have also developed a new method for energy spectral analysis of black hole X-ray binaries; four papers on this topics were presented at the most recent Atlanta AAS meeting. They have also carried Monte-Carlo simulations of X-ray detectors, in support to the hardware development efforts at Marshall Space Flight Center (MSFC). These computation-intensive simulations have been carried out entirely on the computers at UAH. They have also carried out extensive simulations for astrophysical applications, taking advantage of the Monte-Carlo simulation codes developed previously at MSFC and further improved at UAH for detector simulations. One refereed paper and one contribution to conference proceedings have been resulted from this effort.

  11. X-Ray Vision

    NASA Technical Reports Server (NTRS)

    Ramsey, B. D.; Elsner, R. F.; Engelhaupt, D.; Kolodziejczak, J. J.; ODell, S. L.; Speegle, C. O.; Weisskopf, M. C.

    2004-01-01

    We are fabricating optics for the hard-x-ray region using electroless nickel replication. The attraction of this process, which has been widely used elsewhere, is that the resulting full shell optics are inherently stable and thus can have very good angular resolution. The challenge with this process is to develop lightweight optics (nickel has a relatively high density of 8.9 g/cu cm), and to keep down the costs of mandrel fabrication. We accomplished the former through the development of high-strength nickel alloys that permit very thin shells without fabrication- and handling-induced deformations. For the latter, we have utilized inexpensive grinding and diamond turning to figure the mandrels and then purpose-built polishing machines to finish the surface. In-house plating tanks and a simple water-bath separation system complete the process. To date we have built shells ranging in size from 5 cm diameter to 50 cm, and with thickness down to 100 micron. For our HERO balloon program, we are fabricating over 200 iridium-coated shells, 250 microns thick, for hard-x-ray imaging up to 75 keV. Early test results on these have indicated half-power-diameters of 15 arcsec. The status of these and other hard-x-ray optics will be reviewed.

  12. X-ray Spectrometer

    NASA Technical Reports Server (NTRS)

    Porter, F. Scott

    2004-01-01

    The X-ray Spectrometer (XRS) instrument is a revolutionary non-dispersive spectrometer that will form the basis for the Astro-E2 observatory to be launched in 2005. We have recently installed a flight spare X R S microcalorimeter spectrometer at the EBIT-I facility at LLNL replacing the XRS from the earlier Astro-E mission and providing twice the resolution. The X R S microcalorimeter is an x-ray detector that senses the heat deposited by the incident photon. It achieves a high energy resolution by operating at 0.06K and by carefully controlling the heat capacity and thermal conductance. The XRS/EBIT instrument has 32 pixels in a square geometry and achieves an energy resolution of 6 eV at 6 keV, with a bandpass from 0.1 to 12 keV (or more at higher operating temperature). The instrument allows detailed studies of the x-ray line emission of laboratory plasmas. The XRS/EBIT also provides an extensive calibration "library" for the Astro-E2 observatory.

  13. X-ray lithography masking

    NASA Technical Reports Server (NTRS)

    Smith, Henry I. (Inventor); Lim, Michael (Inventor); Carter, James (Inventor); Schattenburg, Mark (Inventor)

    1998-01-01

    X-ray masking apparatus includes a frame having a supporting rim surrounding an x-ray transparent region, a thin membrane of hard inorganic x-ray transparent material attached at its periphery to the supporting rim covering the x-ray transparent region and a layer of x-ray opaque material on the thin membrane inside the x-ray transparent region arranged in a pattern to selectively transmit x-ray energy entering the x-ray transparent region through the membrane to a predetermined image plane separated from the layer by the thin membrane. A method of making the masking apparatus includes depositing back and front layers of hard inorganic x-ray transparent material on front and back surfaces of a substrate, depositing back and front layers of reinforcing material on the back and front layers, respectively, of the hard inorganic x-ray transparent material, removing the material including at least a portion of the substrate and the back layers of an inside region adjacent to the front layer of hard inorganic x-ray transparent material, removing a portion of the front layer of reinforcing material opposite the inside region to expose the surface of the front layer of hard inorganic x-ray transparent material separated from the inside region by the latter front layer, and depositing a layer of x-ray opaque material on the surface of the latter front layer adjacent to the inside region.

  14. Spectroscopic imaging, diffraction, and holography with x-ray photoemission

    SciTech Connect

    Not Available

    1992-02-01

    X-ray probes are capable of determining the spatial structure of an atom in a specific chemical state, over length scales from about a micron all the way down to atomic resolution. Examples of these probes include photoemission microscopy, energy-dependent photoemission diffraction, photoelectron holography, and X-ray absorption microspectroscopy. Although the method of image formation, chemical-state sensitivity, and length scales can be very different, these X-ray techniques share a common goal of combining a capability for structure determination with chemical-state specificity. This workshop will address recent advances in holographic, diffraction, and direct imaging techniques using X-ray photoemission on both theoretical and experimental fronts. A particular emphasis will be on novel structure determinations with atomic resolution using photoelectrons.

  15. Hard x-ray photoelectron spectroscopy study of Ge{sub 2}Sb{sub 2}Te{sub 5}; as-deposited amorphous, crystalline, and laser-reamorphized

    SciTech Connect

    Richter, Jan H. Tominaga, Junji; Fons, Paul; Kolobov, Alex V.; Ueda, Shigenori; Yoshikawa, Hideki; Yamashita, Yoshiyuki; Ishimaru, Satoshi; Kobayashi, Keisuke

    2014-02-10

    We have investigated the electronic structure of as-deposited, crystalline, and laser-reamorphized Ge{sub 2}Sb{sub 2}Te{sub 5} using high resolution, hard x-ray photoemission spectroscopy. A shift in the Fermi level as well as a broadening of the spectral features in the valence band and the Ge 3d level between the amorphous and crystalline state is observed. Upon amorphization, Ge 3d and Sb 4d spectra show a surprisingly small breaking of resonant bonds and changes in the bonding character as evidenced by the very similar density of states in all cases.

  16. Panoramic Dental X-Ray

    MedlinePlus

    ... Physician Resources Professions Site Index A-Z Panoramic Dental X-ray Panoramic dental x-ray uses a ... Your e-mail address: Personal message (optional): Bees: Wax: Notice: RadiologyInfo respects your privacy. Information entered here ...

  17. Fluctuation X-Ray Scattering

    SciTech Connect

    Saldin, PI: D. K.; Co-I's: J. C. H. Spence and P. Fromme

    2013-01-25

    The work supported by the grant was aimed at developing novel methods of finding the structures of biomolecules using x-rays from novel sources such as the x-ray free electron laser and modern synchrotrons

  18. Abdomen X-Ray (Radiography)

    MedlinePlus

    ... examined, an x-ray machine produces a small burst of radiation that passes through the body, recording ... tissue shows up in shades of gray and air appears black. Until recently, x-ray images were ...

  19. Dual X-ray absorptiometry

    NASA Astrophysics Data System (ADS)

    Altman, Albert; Aaron, Ronald

    2012-07-01

    Dual X-ray absorptiometry is widely used in analyzing body composition and imaging. Both the method and its limitations are related to the Compton and photoelectric contributions to the X-ray attenuation coefficients of materials.

  20. Encapsulating X-Ray Detectors

    NASA Technical Reports Server (NTRS)

    Conley, Joseph M.; Bradley, James G.

    1987-01-01

    Vapor-deposited polymer shields crystals from environment while allowing X rays to pass. Polymer coating transparental to X rays applied to mercuric iodide detector in partial vacuum. Coating protects crystal from sublimation, chemical attack, and electrical degradation.

  1. X-Ray Exam: Hip

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Hip KidsHealth > For Parents > X-Ray Exam: Hip A A A What's in this ... español Radiografía: cadera What It Is A hip X-ray is a safe and painless test that uses ...

  2. X-Ray Exam: Wrist

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Wrist KidsHealth > For Parents > X-Ray Exam: Wrist A A A What's in this ... español Radiografía: muñeca What It Is A wrist X-ray is a safe and painless test that uses ...

  3. X-Ray Exam: Ankle

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Ankle KidsHealth > For Parents > X-Ray Exam: Ankle A A A What's in this ... español Radiografía: tobillo What It Is An ankle X-ray is a safe and painless test that uses ...

  4. X-Ray Exam: Foot

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Foot KidsHealth > For Parents > X-Ray Exam: Foot A A A What's in this ... español Radiografía: pie What It Is A foot X-ray is a safe and painless test that uses ...

  5. X-Ray Exam: Finger

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Finger KidsHealth > For Parents > X-Ray Exam: Finger Print A A A What's in ... español Radiografía: dedo What It Is A finger X-ray is a safe and painless test that uses ...

  6. X-Ray Exam: Foot

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Foot KidsHealth > For Parents > X-Ray Exam: Foot Print A A A What's in ... español Radiografía: pie What It Is A foot X-ray is a safe and painless test that uses ...

  7. X-Ray Exam: Ankle

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Ankle KidsHealth > For Parents > X-Ray Exam: Ankle Print A A A What's in ... español Radiografía: tobillo What It Is An ankle X-ray is a safe and painless test that uses ...

  8. X-Ray Exam: Pelvis

    MedlinePlus

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Pelvis KidsHealth > For Parents > X-Ray Exam: Pelvis Print A A A What's in ... español Radiografía: pelvis What It Is A pelvis X-ray is a safe and painless test that uses ...

  9. Tunable X-ray source

    DOEpatents

    Boyce, James R [Williamsburg, VA

    2011-02-08

    A method for the production of X-ray bunches tunable in both time and energy level by generating multiple photon, X-ray, beams through the use of Thomson scattering. The method of the present invention simultaneously produces two X-ray pulses that are tunable in energy and/or time.

  10. Image x-ray emission converters and microstrip porous dielectric x-ray detector

    SciTech Connect

    Lorikyan, M. P.

    2008-11-01

    The effective, fast, and accurate registration of x ray depends on the quality conversion of the X-quanta to photoelectrons. In this respect, of high interest are porous x-ray emission converters (PXECs). They are analogs of porous secondary electron emitters (PSEEs); the only difference is that active porous material should have high absorption properties for the X-quanta energies to be detected. Microstrip porous dielectric detector (MSPDD) is highly effective for x-ray registration without preliminary conversion of the X-quanta. Earlier it was shown that PSEE similar to PXEC has a high emission factor for 1-2 MeV {beta}-particles and 5 MeV {alpha}-particles. It was shown that MSPDDs and PSEEs are very stable.

  11. Magnetic x-ray dichroism in ultrathin epitaxial films

    SciTech Connect

    Tobin, J.G.; Goodman, K.W.; Cummins, T.R.

    1997-04-01

    The authors have used Magnetic X-ray Linear Dichroism (MXLD) and Magnetic X-ray Circular Dichroism (MXCD) to study the magnetic properties of epitaxial overlayers in an elementally specific fashion. Both MXLD and MXCD Photoelectron Spectroscopy were performed in a high resolution mode at the Spectromicroscopy Facility of the ALS. Circular Polarization was obtained via the utilization of a novel phase retarder (soft x-ray quarter wave plate) based upon transmission through a multilayer film. The samples were low temperature Fe overlayers, magnetic alloy films of NiFe and CoNi, and Gd grown on Y. The authors results include a direct comparison of high resolution angle resolved Photoelectron Spectroscopy performed in MXLD and MXCD modes as well as structural studies with photoelectron diffraction.

  12. X-ray satellite

    NASA Technical Reports Server (NTRS)

    1985-01-01

    An overview of the second quarter 1985 development of the X-ray satellite project is presented. It is shown that the project is proceeding according to plan and that the projected launch date of September 9, 1987 is on schedule. An overview of the work completed and underway on the systems, subsystems, payload, assembly, ground equipment and interfaces is presented. Problem areas shown include cost increases in the area of focal instrumentation, the star sensor light scattering requirements, and postponements in the data transmission subsystems.

  13. SMM x ray polychromator

    NASA Technical Reports Server (NTRS)

    Saba, J. L. R.

    1993-01-01

    The objective of the X-ray Polychromator (XRP) experiment was to study the physical properties of solar flare plasma and its relation to the parent active region to understand better the flare mechanism and related solar activity. Observations were made to determine the temperature, density, and dynamic structure of the pre-flare and flare plasma as a function of wavelength, space and time, the extent to which the flare plasma departs from thermal equilibrium, and the variation of this departure with time. The experiment also determines the temperature and density structure of active regions and flare-induced changes in the regions.

  14. Hard and soft x-ray standing-wave photoelectron spectroscopy and angle-resolved photoemission spectroscopy study of LaNiO3/SrTiO 3 superlattice and its interfaces

    NASA Astrophysics Data System (ADS)

    Eiteneer, Daria N.

    Abstract Many classes of materials that exhibit interesting characteristics in the modulation of the electronic and magnetic properties when they are made of more than one compound, often arranged in multilayers and superlattices. In such cases, the electronic, electric, and magnetic properties of the multilayer, as well as their densities-of-states, are vastly different from the properties of the constituent materials, with the most important features often located at the interfaces. Specifically, perovskite nickelates are examples of materials that lie at the heart of correlated electron physics. Prior studies have been done on superlattices that contain multilayers of two perovskites. Specifically, it has been shown that LaNiO3 (LNO) undergoes a Mott metal-insulator transition when sandwiched between the layers of SrTiO3 (STO). However, even with prior theoretical simulations and experimental studies, no conclusion has been reached so far as to the exact reason for such a transition. To further the investigation of these ideas, we are undertaking a detailed study of the electronic structure of a LaNiO3/SrTiO3 superlattice with 10 repeats of [4 unit-cell LNO/3 unit-cell STO] bilayer grown on an (LaAlO3)0.3(Sr2AlTaO6)0.7 substrate. To provide a complete characterization of this superlattice, it is crucial to characterize the core levels of the atoms at the interface, as well as to measure the depth-dependent density of states and the element-specific magnetization through the interface. The standing-wave photoemission technique provides a unique capability for characterizing the LNO/STO interfaces by depth-resolving the electronic structure of the superlattice, particularly in its momentum-resolving form of standing-wave angle-resolved photoemission using soft x-rays in the ca. 1 keV regime. The main advantages of SW-XPS are its non-destructiveness, large effective attenuation length, and the enhanced depth resolution for buried interfaces via standing

  15. X-ray position detector and implementation in a mirror pointing servo system

    SciTech Connect

    Rabedeau, Thomas A.; Van Campen, Douglas G.; Stefan, Peter M.

    2016-04-05

    An X-ray beam position and stability detector is provided having a first metal blade collinear with a second metal blade, where an edge of the first metal blade is opposite an edge of the second metal blade, where the first metal blade edge and the second metal blade edge are disposed along a centerline with respect to each other, where the metal blades are capable of photoelectron emission when exposed to an x-ray beam, a metal coating on the metal blades that is capable of enhancing the photoelectron emission, or suppressing energy-resonant contaminants, or enhancing the photoelectron emission and suppressing energy-resonant contaminants, a background shielding element having an electrode capable of suppressing photoelectron emission from spurious x-rays not contained in an x-ray beam of interest, and a photoelectron emission detector having an amplifier capable of detecting the photoelectron emission as a current signal.

  16. X-ray lithography source

    DOEpatents

    Piestrup, Melvin A.; Boyers, David G.; Pincus, Cary

    1991-01-01

    A high-intensity, inexpensive X-ray source for X-ray lithography for the production of integrated circuits. Foil stacks are bombarded with a high-energy electron beam of 25 to 250 MeV to produce a flux of soft X-rays of 500 eV to 3 keV. Methods of increasing the total X-ray power and making the cross section of the X-ray beam uniform are described. Methods of obtaining the desired X-ray-beam field size, optimum frequency spectrum and elminating the neutron flux are all described. A method of obtaining a plurality of station operation is also described which makes the process more efficient and economical. The satisfying of these issues makes transition radiation an exellent moderate-priced X-ray source for lithography.

  17. X-ray lithography source

    DOEpatents

    Piestrup, M.A.; Boyers, D.G.; Pincus, C.

    1991-12-31

    A high-intensity, inexpensive X-ray source for X-ray lithography for the production of integrated circuits is disclosed. Foil stacks are bombarded with a high-energy electron beam of 25 to 250 MeV to produce a flux of soft X-rays of 500 eV to 3 keV. Methods of increasing the total X-ray power and making the cross section of the X-ray beam uniform are described. Methods of obtaining the desired X-ray-beam field size, optimum frequency spectrum and eliminating the neutron flux are all described. A method of obtaining a plurality of station operation is also described which makes the process more efficient and economical. The satisfying of these issues makes transition radiation an excellent moderate-priced X-ray source for lithography. 26 figures.

  18. Speciation of uranium and doping induced defects in Gd1.98U0.02Zr2O7: Photoluminescence, X-ray photoelectron and positron annihilation lifetime spectroscopy

    NASA Astrophysics Data System (ADS)

    Gupta, Santosh K.; Reghukumar, C.; Pathak, Nimai; Sudarshan, K.; Tyagi, D.; Mohapatra, M.; Pujari, P. K.; Kadam, R. M.

    2017-02-01

    Based on photoluminescence spectroscopy it was inferred that uranium stabilizes as both U(IV) as well as U(VI) in Gd2Zr2O7 which was also corroborated using X-ray photo electron spectroscopy (XPS). Absence of equidistant vibronic structure in emission spectrum of Gd1.98U0.02Zr2O7 confirmed that U(VI) stabilizes in the form of UO66-. Based on luminescence lifetime it was inferred that majority of UO66- stabilizes at both Gd3+/Zr4+ whereas U4+ stabilizes only at Zr4+ sites. The positron lifetime doesn't change on uranium doping indicating the formation of antisite defect. Infact it is this antisite defect in Gd1.98U0.02Zr2O7 which favours the stabilization of its fluorite phase.

  19. The C-S-H gel of Portland cement mortars: Part I. The interpretation of energy-dispersive X-ray microanalyses from scanning electron microscopy, with some observations on C-S-H, AFm and AFt phase compositions

    SciTech Connect

    Famy, C.; Brough, A.R.; Taylor, H.F.W

    2003-09-01

    Scanning electron microscopy (SEM) microanalyses of the calcium-silicate-hydrate (C-S-H) gel in Portland cement pastes rarely represent single phases. Essential experimental requirements are summarised and new procedures for interpreting the data are described. These include, notably, plots of Si/Ca against other atom ratios, 3D plots to allow three such ratios to be correlated and solution of linear simultaneous equations to test and quantify hypotheses regarding the phases contributing to individual microanalyses. Application of these methods to the C-S-H gel of a 1-day-old mortar identified a phase with Al/Ca=0.67 and S/Ca=0.33, which we consider to be a highly substituted ettringite of probable composition C{sub 6}A{sub 2}S-bar{sub 2}H{sub 34} or {l_brace}Ca{sub 6}[Al(OH){sub 6}]{sub 2}{center_dot}24H{sub 2}O{r_brace}(SO{sub 4}){sub 2}[Al(OH){sub 4}]{sub 2}. If this is true for Portland cements in general, it might explain observed discrepancies between observed and calculated aluminate concentrations in the pore solution. The C-S-H gel of a similar mortar aged 600 days contained unsubstituted ettringite and an AFm phase with S/Ca=0.125.

  20. Development of high resolution imaging detectors for x ray astronomy

    NASA Technical Reports Server (NTRS)

    Murray, S. S.; Schwartz, D. A.

    1992-01-01

    This final report summarizes our past activities and discusses the work performed over the period of 1 April 1990 through 1 April 1991 on x-ray optics, soft x-ray (0.1 - 10 KeV) imaging detectors, and hard x-ray (10 - 300 KeV) imaging detectors. If microchannel plates (MCPs) can be used to focus x-rays with a high efficiency and good angular resolution, they will revolutionize the field of x-ray optics. An x-ray image of a point source through an array of square MCP pores compared favorably with our ray tracing model for the MCP. Initial analysis of this image demonstrates the feasibility of MCPs for soft x-rays. Our work continues with optimizing the performance of our soft x-ray MCP imaging detectors. This work involves readout technology that should provide improved MCP readout devices (thin film crossed grid, curved, and resistive sheets), defect removal in MCPs, and photocathode optimization. In the area of hard x-ray detector development we have developed two different techniques for producing a CsI photocathode thickness of 10 to 100 microns, such that it is thick enough to absorb the high energy x-rays and still allow the photoelectrons to escape to the top MCP of a modified soft x-ray imaging detector. The methods involve vacuum depositing a thick film of CsI on a strong back, and producing a converter device that takes the place of the photocathode.

  1. Hard X-Ray Emission of X-Ray Bursters

    NASA Technical Reports Server (NTRS)

    Kaaret, P.

    1999-01-01

    The primary goal of this proposal was to perform an accurate measurement of the broadband x-ray spectrum of a neutron-star low-mass x-ray binary found in a hard x-ray state. This goal was accomplished using data obtained under another proposal, which has provided exciting new information on the hard x-ray emission of neutron-star low-mass x-ray binaries. In "BeppoSAX Observations of the Atoll X-Ray Binary 4U0614+091", we present our analysis of the spectrum of 4U0614+091 over the energy band from 0.3-150 keV. Our data confirm the presence of a hard x-ray tail that can be modeled as thermal Comptonization of low-energy photons on electrons having a very high temperature, greater than 220 keV, or as a non-thermal powerlaw. Such a very hard x-ray spectrum has not been previously seen from neutron-star low-mass x-ray binaries. We also detected a spectral feature that can be interpreted as reprocessing, via Compton reflection, of the direct emission by an optically-thick disk and found a correlation between the photon index of the power-law tail and the fraction of radiation reflected which is similar to the correlation found for black hole candidate x-ray binaries and Seyfert galaxies. A secondary goal was to measure the timing properties of the x-ray emission from neutronstar low-mass x-ray binaries in their low/hard states.

  2. Effects of O{sub 3} and H{sub 2}O oxidants on C and N-related impurities in atomic-layer-deposited La{sub 2}O{sub 3} films observed by in situ x-ray photoelectron spectroscopy

    SciTech Connect

    Park, Tae Joo; Sivasubramani, Prasanna; Coss, Brian E.; Kim, Hyun-Chul; Lee, Bongki; Wallace, Robert M.; Kim, Jiyoung; Rousseau, Mike; Liu Xinye; Li Huazhi; Lehn, Jean-Sebastien; Hong, Daewon; Shenai, Deo

    2010-08-30

    The effect of H{sub 2}O and O{sub 3} oxidants on the behavior of residual C and N-related impurities as well as Si out-diffusion and interfacial layer formation in atomic-layer-deposited La{sub 2}O{sub 3} films grown at 250 deg. C were examined using in situ x-ray photoelectron spectroscopy. The silicate formation was suppressed in a La{sub 2}O{sub 3} film grown using O{sub 3} compared to that deposited using H{sub 2}O, but interfacial layer growth was enhanced. The accumulation of C and N-related residues with low binding energy, which originated from incomplete reactions, was suppressed in La{sub 2}O{sub 3} films grown using O{sub 3}. However, the use of O{sub 3} resulted in La-carbonate phase in film.

  3. Miniature x-ray source

    DOEpatents

    Trebes, James E.; Stone, Gary F.; Bell, Perry M.; Robinson, Ronald B.; Chornenky, Victor I.

    2002-01-01

    A miniature x-ray source capable of producing broad spectrum x-ray emission over a wide range of x-ray energies. The miniature x-ray source comprises a compact vacuum tube assembly containing a cathode, an anode, a high voltage feedthru for delivering high voltage to the anode, a getter for maintaining high vacuum, a connection for an initial vacuum pump down and crimp-off, and a high voltage connection for attaching a compact high voltage cable to the high voltage feedthru. At least a portion of the vacuum tube wall is highly x-ray transparent and made, for example, from boron nitride. The compact size and potential for remote operation allows the x-ray source, for example, to be placed adjacent to a material sample undergoing analysis or in proximity to the region to be treated for medical applications.

  4. British X-ray astronomy

    NASA Astrophysics Data System (ADS)

    Pounds, K. A.

    1986-09-01

    The development of solar and cosmic X-ray studies in the UK, in particular the Skylark and Ariel programs, is discussed. The characteristics and capabilities of the X-ray emulsion detector developed to monitor the solar X-radiation in the Skylark program, and of the proportional counter spectrometer developed for solar X-ray measurements on the Ariel I satellite are described. The designs and functions of the pin-hole camera, the Bragg crystal spectrometer, and the X-ray spectroheliograph are exmained. The Skylark observations of cosmic X-ray sources and high-resolution solar spectra, and the Ariel 5 data on cosmic X-ray sources are presented. Consideration is given to the Ariel 6, the U.S. Einstein Observatory, Exosat, and ASTRO-C.

  5. Solar X-ray physics

    SciTech Connect

    Bornmann, P.L. )

    1991-01-01

    Research on solar X-ray phenomena performed by American scientists during 1987-1990 is reviewed. Major topics discussed include solar images observed during quiescent times, the processes observed during solar flares, and the coronal, interplanetary, and terrestrial phenomena associated with solar X-ray flares. Particular attention is given to the hard X-ray emission observed at the start of the flare, the energy transfer to the soft X-ray emitting plasma, the late resolution of the flare as observed in soft X-ray, and the rate of occurrence of solar flares as a function of time and latitude. Pertinent aspects of nonflaring, coronal X-ray emission and stellar flares are also discussed. 175 refs.

  6. Topological X-Rays Revisited

    ERIC Educational Resources Information Center

    Lynch, Mark

    2012-01-01

    We continue our study of topological X-rays begun in Lynch ["Topological X-rays and MRI's," iJMEST 33(3) (2002), pp. 389-392]. We modify our definition of a topological magnetic resonance imaging and give an affirmative answer to the question posed there: Can we identify a closed set in a box by defining X-rays to probe the interior and without…

  7. X-Ray Polarization Imaging

    DTIC Science & Technology

    2006-07-01

    anatomic structures. Johns and Yaffe (2), building on the work of Alvarez and Macovski (3) and that of Lehmann et al (4), discuss a method for...sources of contrast related to both the wave and par- ticulate nature of x rays. References 1. Johns PC, Yaffe MJ. X-ray characterization of normal and...application to mammography. Med Phys 1985; 12:289–296. 3. Alvarez RE, Macovski A. Energy-selective reconstructions in x-ray computerized tomography. Phys

  8. X-ray Absorption Spectroscopy

    SciTech Connect

    Yano, Junko; Yachandra, Vittal K.

    2009-07-09

    This review gives a brief description of the theory and application of X-ray absorption spectroscopy, both X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS), especially, pertaining to photosynthesis. The advantages and limitations of the methods are discussed. Recent advances in extended EXAFS and polarized EXAFS using oriented membranes and single crystals are explained. Developments in theory in understanding the XANES spectra are described. The application of X-ray absorption spectroscopy to the study of the Mn4Ca cluster in Photosystem II is presented.

  9. X-ray photonics: Bending X-rays with nanochannels

    NASA Astrophysics Data System (ADS)

    Pelliccia, Daniele

    2016-02-01

    X-ray counterparts of visible light optical elements are notoriously difficult to realize because the refractive index of all materials is close to unity. It has now been demonstrated that curved waveguides fabricated on a silicon chip can channel and deflect X-ray beams by consecutive grazing reflections.

  10. Actinide science with soft x-ray synchrotron radiation

    NASA Astrophysics Data System (ADS)

    Shuh, David K.

    2000-07-01

    The primary methods for the experimental investigation of actinide materials in the VUV/soft x-ray region are the complementary photoelectron spectroscopies, near-edge x-ray absorption fine structure (NEXAFS), and x-ray emission spectroscopy (XES) techniques. Resonant photoemission techniques capable of resolving the 5f electron contributions to actinide bonding along with angle-resolving measurements for band structure and surface structure determinations, have clear and immediate applications. Venerable angle-integrating core and valence band photoelectron spectroscopy are valuable for characterization and analytical purposes. Combined with results from NEXAFS measurements, these techniques will provide the information needed to develop improved understandings of the electronic structure of actinide materials and their surface chemistries/physics.

  11. X-Ray Exam: Wrist

    MedlinePlus

    ... tissues and the ends of the forearm bones (radius and ulna) and eight small wrist bones (carpal bones). The X-ray image is black and white. Dense structures that block the passage of the X-ray beam through the body, such as the bones, appear white on the image. Softer ...

  12. X-ray based extensometry

    NASA Technical Reports Server (NTRS)

    Jordan, E. H.; Pease, D. M.

    1988-01-01

    A totally new method of extensometry using an X-ray beam was proposed. The intent of the method is to provide a non-contacting technique that is immune to problems associated with density variations in gaseous environments that plague optical methods. X-rays are virtually unrefractable even by solids. The new method utilizes X-ray induced X-ray fluorescence or X-ray induced optical fluorescence of targets that have melting temperatures of over 3000 F. Many different variations of the basic approaches are possible. In the year completed, preliminary experiments were completed which strongly suggest that the method is feasible. The X-ray induced optical fluorescence method appears to be limited to temperatures below roughly 1600 F because of the overwhelming thermal optical radiation. The X-ray induced X-ray fluorescence scheme appears feasible up to very high temperatures. In this system there will be an unknown tradeoff between frequency response, cost, and accuracy. The exact tradeoff can only be estimated. It appears that for thermomechanical tests with cycle times on the order of minutes a very reasonable system may be feasible. The intended applications involve very high temperatures in both materials testing and monitoring component testing. Gas turbine engines, rocket engines, and hypersonic vehicles (NASP) all involve measurement needs that could partially be met by the proposed technology.

  13. Dual x-ray absorptiometry

    NASA Astrophysics Data System (ADS)

    Altman, Albert; Aaron, Ronald

    2011-04-01

    Dual x-ray absorptiometry is widely used in analyzing body composition and imaging. We discuss the physics of the method and exhibit its limitations and show it is related to the Compton and photoelectric contributions to the x-ray absorption coefficients of materials.

  14. The infrared continuum spectrum of x ray illuminated molecular gas

    NASA Technical Reports Server (NTRS)

    Voit, G. Mark

    1990-01-01

    In starburst galaxies, active galaxies, and the mysterious ultraluminous infrared galaxies, x rays are likely to interact with molecular gas and dust, thereby inducing infrared emission. X ray heated thermal dust will emit the IR continuum, and x ray photoelectrons will excite an IR emission-line spectrum. Here, researchers model the IR continuum emission characteristic of some selected x ray spectral fluxes, in particular the x ray bremsstrahlung characteristic of supernova and stellar wind bubble shocks in dense media and the power law spectra characteristic of active galactic nuclei. These models are part of a larger project to determine the complete IR spectra, lines plus continuum, of x ray sources embedded in molecular gas. They modeled the thermal emission from grains by calculating a grain temperature/size/composition distribution function, f(T,a,Comp.), which accounts for temperature fluctuations by averaging over all grain thermal histories. In determining the grain thermal distribution, researchers account for both direct grain heating (by x ray absorption and subsequent electron energy deposition) and indirect grain heating (by absorption of the UV emission stimulated by non-thermal photo- and Auger electrons in the gas phase). We let the grain size distribution be proportional to a(exp -3.5), and they consider two types of grain composition: graphites, which we assume to be pure carbon, and silicates, which contain all other depleted heavy elements. They derive the grain composition distribution function from solar abundances and interstellar depletion data.

  15. Focusing X-Ray Telescopes

    NASA Technical Reports Server (NTRS)

    O'Dell, Stephen; Brissenden, Roger; Davis, William; Elsner, Ronald; Elvis, Martin; Freeman, Mark; Gaetz, Terrance; Gorenstein, Paul; Gubarev, Mikhall; Jerlus, Diab; Juda, Michael; Kolodziejczak, Jeffrey; Murray, Stephen; Petre, Robert; Podgorski, William; Ramsey, Brian; Reid, Paul; Saha, Timo; Wolk, Scott; Troller-McKinstry, Susan; Weisskopf, Martin; Wilke, Rudeger; Zhang, William

    2010-01-01

    During the half-century history of x-ray astronomy, focusing x-ray telescopes, through increased effective area and finer angular resolution, have improved sensitivity by 8 orders of magnitude. Here, we review previous and current x-ray-telescope missions. Next, we describe the planned next-generation x-ray-astronomy facility, the International X-ray Observatory (IXO). We conclude with an overview of a concept for the next next-generation facility, Generation X. Its scientific objectives will require very large areas (about 10,000 sq m) of highly-nested, lightweight grazing-incidence mirrors, with exceptional (about 0.1-arcsec) resolution. Achieving this angular resolution with lightweight mirrors will likely require on-orbit adjustment of alignment and figure.

  16. X-ray shearing interferometer

    DOEpatents

    Koch, Jeffrey A.

    2003-07-08

    An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1.times. magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.

  17. X-Ray Diffraction Apparatus

    NASA Technical Reports Server (NTRS)

    Blake, David F. (Inventor); Bryson, Charles (Inventor); Freund, Friedmann (Inventor)

    1996-01-01

    An x-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample is introduced. The apparatus includes a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, a holder for holding the sample to be analyzed in the path of the beam, and a charge-coupled device having an array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam. The CCD is coupled to an output unit which receives input information relating to the energies of photons striking each pixel in the CCD, and constructs the diffraction pattern of photons within a selected energy range striking the CCD.

  18. X-Ray Tomographic Reconstruction

    SciTech Connect

    Bonnie Schmittberger

    2010-08-25

    Tomographic scans have revolutionized imaging techniques used in medical and biological research by resolving individual sample slices instead of several superimposed images that are obtained from regular x-ray scans. X-Ray fluorescence computed tomography, a more specific tomography technique, bombards the sample with synchrotron x-rays and detects the fluorescent photons emitted from the sample. However, since x-rays are attenuated as they pass through the sample, tomographic scans often produce images with erroneous low densities in areas where the x-rays have already passed through most of the sample. To correct for this and correctly reconstruct the data in order to obtain the most accurate images, a program employing iterative methods based on the inverse Radon transform was written. Applying this reconstruction method to a tomographic image recovered some of the lost densities, providing a more accurate image from which element concentrations and internal structure can be determined.

  19. LiNi 0.8 Co 0.2 O 2 -based high power lithium-ion battery positive electrodes analyzed by x-ray photoelectron spectroscopy: 1. Fresh electrode

    SciTech Connect

    Haasch, Richard T.; Abraham, Daniel A.

    2016-12-01

    High-power lithium-ion batteries are rapidly replacing the nickel metal hydride batteries currently used for energy storage in hybrid electric vehicles. Widespread commercialization of these batteries for vehicular applications is, however, limited by calendar-life performance, thermal abuse characteristics, and cost. The Advanced Technology Development Program was established by the U.S. Department of Energy to address these limitations. An important objective of this program was the development and application of diagnostic tools that provide unique ways to investigate the phenomena that limit lithium-ion cell life, performance, and safety characteristics. This report introduces a set of six Surface Science Spectra xray photoelectron spectroscopy (XPS) comparison records of data collected from positive electrodes (cathode) harvested from cylindrically wound, 18650-type, 1 A h capacity cells. The cathodes included in this study are (1) fresh, (2) following three formation cycles, (3) following calendar-life test for 12 weeks at 40 C, 60% state-of-charge (SOC), (4) following calendar-life test for 8 weeks at 50 C, 60% SOC, (5) following calendar-life test for 8 weeks at 60 C, 60% SOC, and (6) following calendar-life test for 2 weeks at 70 C, 60% SOC.

  20. LiNi 0.8 Co 0.2 O 2 -based high power lithium-ion battery positive electrodes analyzed by x-ray photoelectron spectroscopy: 2. Following 3 formation cycles

    SciTech Connect

    Haasch, Richard T.; Abraham, Daniel A.

    2016-12-01

    High-power lithium-ion batteries are rapidly replacing the nickel metal hydride batteries currently used for energy storage in hybrid electric vehicles. Widespread commercialization of these batteries for vehicular applications is, however, limited by calendar-life performance, thermal abuse characteristics, and cost. The Advanced Technology Development Program was established by the U.S. Department of Energy to address these limitations. An important objective of this program was the development and application of diagnostic tools that provide unique ways to investigate the phenomena that limit lithium-ion cell life, performance, and safety characteristics. This report introduces a set of six Surface Science Spectra xray photoelectron spectroscopy (XPS) comparison records of data collected from positive electrodes (cathode) harvested from cylindrically wound, 18650-type, 1 A h capacity cells. The cathodes included in this study are (1) fresh, (2) following three formation cycles, (3) following calendar-life test for 12 weeks at 40 C, 60% state-of-charge (SOC), (4) following calendar-life test for 8 weeks at 50 C, 60% SOC, (5) following calendar-life test for 8 weeks at 60 C, 60% SOC, and (6) following calendar-life test for 2 weeks at 70 C, 60% SOC.