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Sample records for all-metal thick film

  1. Development of an all-metal thick film cost effective metallization system for solar cells

    NASA Technical Reports Server (NTRS)

    Ross, B.; Parker, J.

    1983-01-01

    Improved thick film solar cell contacts for the high volume production of low cost silicon solar arrays are needed. All metal screenable pastes made from economical base metals and suitable for application to low to high conductivity silicon were examined. Silver fluoride containing copper pastes and fluorocarbon containing copper pastes were discussed. The effect of hydrogen on the adhesion of metals to silicon was investigated. A cost analysis of various paste materials is provided.

  2. Development of an all-metal thick film cost effective metallization system for solar cells

    NASA Astrophysics Data System (ADS)

    Ross, B.; Parker, J.

    1983-12-01

    Improved thick film solar cell contacts for the high volume production of low cost silicon solar arrays are needed. All metal screenable pastes made from economical base metals and suitable for application to low to high conductivity silicon were examined. Silver fluoride containing copper pastes and fluorocarbon containing copper pastes were discussed. The effect of hydrogen on the adhesion of metals to silicon was investigated. A cost analysis of various paste materials is provided.

  3. Development of an all-metal thick film cost affective metallization system for solar cells

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1981-01-01

    An economical thick film solar cell contact for high volume production of low cost silicon solar array modules was investigated. All metal screenable pastes using base metals were studied. Solar cells with junction depths varying by a factor of 3.3, with and without a deposited oxide coating were used. Cells were screened and fired by a two step firing process. Adhesion and metallurgical results are unsatisfactory. No electrical information is obtained due to inadequate contact adhesion.

  4. Development of an all-metal thick film cost effective metallization system for solar cells

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1981-01-01

    The objectives of the investigation were to provide all-metal screenable pastes using economical base metals, suitable for application to low-to-high conductivity silicon of either conductivity type and possibly to aluminum surfaces. Experiments were conducted with variations in paste parameters, firing conditions, including gas ambients, furnace furniture, silicon surface and others. A liquid medium, intended to provide transport during the carbon fluoride decomposition was incorporated in the paste with promising results.

  5. Thick film hydrogen sensor

    DOEpatents

    Hoffheins, Barbara S.; Lauf, Robert J.

    1995-01-01

    A thick film hydrogen sensor element includes an essentially inert, electrically-insulating substrate having deposited thereon a thick film metallization forming at least two resistors. The metallization is a sintered composition of Pd and a sinterable binder such as glass frit. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors.

  6. Thick film hydrogen sensor

    DOEpatents

    Hoffheins, B.S.; Lauf, R.J.

    1995-09-19

    A thick film hydrogen sensor element includes an essentially inert, electrically-insulating substrate having deposited thereon a thick film metallization forming at least two resistors. The metallization is a sintered composition of Pd and a sinterable binder such as glass frit. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors. 8 figs.

  7. Thick Film Interference.

    ERIC Educational Resources Information Center

    Trefil, James

    1983-01-01

    Discusses why interference effects cannot be seen with a thick film, starting with a review of the origin of interference patterns in thin films. Considers properties of materials in films, properties of the light source, and the nature of light. (JN)

  8. Lonsdaleite Films with Nanometer Thickness.

    PubMed

    Kvashnin, Alexander G; Sorokin, Pavel B

    2014-02-06

    We investigate the properties of potentially the stiffest quasi-2-D films with lonsdaleite structure. Using a combination of ab initio and empirical potential approaches, we analyze the elastic properties of lonsdaleite films in both elastic and inelastic regimes and compare them with graphene and diamond films. We review possible fabrication methods of lonsdaleite films using the pure nanoscale "bottom-up" paradigm: by connecting carbon layers in multilayered graphene. We propose the realization of this method in two ways: by applying direct pressure and by using the recently proposed chemically induced phase transition. For both cases, we construct the phase diagrams depending on temperature, pressure, and film thickness. Finally, we consider the electronic properties of lonsdaleite films and establish the nonlinear dependence of the band gap on the films' thicknesses and their lower effective masses in comparison with bulk crystal.

  9. System for measuring film thickness

    DOEpatents

    Batishko, Charles R.; Kirihara, Leslie J.; Peters, Timothy J.; Rasmussen, Donald E.

    1990-01-01

    A system for determining the thicknesses of thin films of materials exhibiting fluorescence in response to exposure to excitation energy from a suitable source of such energy. A section of film is illuminated with a fixed level of excitation energy from a source such as an argon ion laser emitting blue-green light. The amount of fluorescent light produced by the film over a limited area within the section so illuminated is then measured using a detector such as a photomultiplier tube. Since the amount of fluorescent light produced is a function of the thicknesses of thin films, the thickness of a specific film can be determined by comparing the intensity of fluorescent light produced by this film with the intensity of light produced by similar films of known thicknesses in response to the same amount of excitation energy. The preferred embodiment of the invention uses fiber optic probes in measuring the thicknesses of oil films on the operational components of machinery which are ordinarily obscured from view.

  10. Measuring Thicknesses of Wastewater Films

    NASA Technical Reports Server (NTRS)

    Schubert, F. H.; Davenport, R. J.

    1987-01-01

    Sensor determines when thickness of film of electrically conductive wastewater on rotating evaporator drum exceeds preset value. Sensor simple electrical probe that makes contact with liquid surface. Made of materials resistant to chemicals in liquid. Mounted on shaft in rotating cylinder, liquid-thickness sensor extends toward cylinder wall so tip almost touches. Sensor body accommodates probe measuring temperature of evaporated water in cylinder.

  11. Applications of film thickness equations

    NASA Technical Reports Server (NTRS)

    Hamrock, B. J.; Dowson, D.

    1983-01-01

    A number of applications of elastohydrodynamic film thickness expressions were considered. The motion of a steel ball over steel surfaces presenting varying degrees of conformity was examined. The equation for minimum film thickness in elliptical conjunctions under elastohydrodynamic conditions was applied to roller and ball bearings. An involute gear was also introduced, it was again found that the elliptical conjunction expression yielded a conservative estimate of the minimum film thickness. Continuously variable-speed drives like the Perbury gear, which present truly elliptical elastohydrodynamic conjunctions, are favored increasingly in mobile and static machinery. A representative elastohydrodynamic condition for this class of machinery is considered for power transmission equipment. The possibility of elastohydrodynamic films of water or oil forming between locomotive wheels and rails is examined. The important subject of traction on the railways is attracting considerable attention in various countries at the present time. The final example of a synovial joint introduced the equation developed for isoviscous-elastic regimes of lubrication.

  12. LTCC Thick Film Process Characterization

    SciTech Connect

    Girardi, M. A.; Peterson, K. A.; Vianco, P. T.

    2016-05-01

    Low temperature cofired ceramic (LTCC) technology has proven itself in military/space electronics, wireless communication, microsystems, medical and automotive electronics, and sensors. The use of LTCC for high frequency applications is appealing due to its low losses, design flexibility and packaging and integration capability. Moreover, we summarize the LTCC thick film process including some unconventional process steps such as feature machining in the unfired state and thin film definition of outer layer conductors. The LTCC thick film process was characterized to optimize process yields by focusing on these factors: 1) Print location, 2) Print thickness, 3) Drying of tapes and panels, 4) Shrinkage upon firing, and 5) Via topography. Statistical methods were used to analyze critical process and product characteristics in the determination towards that optimization goal.

  13. LTCC Thick Film Process Characterization

    DOE PAGES

    Girardi, M. A.; Peterson, K. A.; Vianco, P. T.

    2016-05-01

    Low temperature cofired ceramic (LTCC) technology has proven itself in military/space electronics, wireless communication, microsystems, medical and automotive electronics, and sensors. The use of LTCC for high frequency applications is appealing due to its low losses, design flexibility and packaging and integration capability. Moreover, we summarize the LTCC thick film process including some unconventional process steps such as feature machining in the unfired state and thin film definition of outer layer conductors. The LTCC thick film process was characterized to optimize process yields by focusing on these factors: 1) Print location, 2) Print thickness, 3) Drying of tapes and panels,more » 4) Shrinkage upon firing, and 5) Via topography. Statistical methods were used to analyze critical process and product characteristics in the determination towards that optimization goal.« less

  14. Measurement of opaque film thickness

    NASA Technical Reports Server (NTRS)

    Thomas, R. L.; Jaarinen, J.; Reyes, C.; Oppenheim, I. C.; Favro, L. D.; Kuo, P. K.

    1987-01-01

    The theoretical and experimental framework for thickness measurements of thin metal films by low frequency thermal waves is described. Although it is assumed that the films are opaque and the substrates are comparatively poor thermal conductors, the theory is easily extended to other cases of technological interest. A brief description is given of the thermal waves and the experimental arrangement and parameters. The usefulness of the technique is illustrated for making absolute measurements of the thermal diffusivities of isotropic substrate materials. This measurement on pure elemental solids provides a check on the three dimensional theory in the limiting case of zero film thickness. The theoretical framework is then presented, along with numerical calculations and corresponding experimental results for the case of copper films on a glass substrate.

  15. Development of an all-metal thick film cost effective metallization system for solar cells

    NASA Technical Reports Server (NTRS)

    Ross, B.; Parker, J.

    1982-01-01

    Electrodes made with pastes produced under the previous contract were analyzed and compared with raw materials. A needle-like structure observed on the electroded solar cell was identified as eutectic copper-silicon, a phase considered to benefit the electrical and metallurgical properties of the contact. Electrodes made from copper fluorocarbon and copper silver fluoride also contained this phase but had poor adhesion. A liquid medium, intended to provide transport during carbon fluoride decomposition was incorporated into the paste resulting in better adhesion. The product survived preliminary environmental tests. A 2 cm by 2 cm solar cell made with fluorocarbon activated copper electrodes and gave 7% AMI efficiency (without AR coating). Both silver fluoride and fluorocarbon screened paste electrodes can be produced for approximately $0.04 per watt.

  16. Development of an All-Metal Thick Film Cost Effective Metallization System for Solar Cells

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1980-01-01

    Materials including copper powders, silver-fluoride, and silicon wafers were procured and copper pastes were prepared. Electrodes made with copper pastes were analyzed and compared with the raw materials. A needle-like structure was observed on the electroded solar cells, and was identified as eutectic copper-silicon by electron probe X-ray spectroscopy. The existence of this phase was thought to benefit electrical and metallurgical properties of the contact. Subsequently electrodes made from new material were also shown to contain this phase while simultaneously having poor adhesion.

  17. Vacuum casting of thick polymeric films

    NASA Technical Reports Server (NTRS)

    Cuddihy, E. F.; Moacanin, J.

    1979-01-01

    Bubble formation and layering, which often plague vacuum-evaporated films, are prevented by properly regulating process parameters. Vacuum casting may be applicable to forming thick films of other polymer/solvent solutions.

  18. Micro-droplets lubrication film thickness dynamics

    NASA Astrophysics Data System (ADS)

    Huerre, Axel; Theodoly, Olivier; Cantat, Isabelle; Leshansky, Alexander; Valignat, Marie-Pierre; Jullien, Marie-Caroline; MMN Team; LAI Team; IPR Team; Department of Chemical Engineering Team

    2014-11-01

    The motion of droplets or bubbles in confined geometries has been extensively studied; showing an intrinsic relationship between the lubrication film thickness and the droplet velocity. When capillary forces dominate, the lubrication film thickness evolves non linearly with the capillary number due to viscous dissipation between meniscus and wall. However, this film may become thin enough that intermolecular forces come into play and affect classical scalings. We report here the first experimental evidence of the disjoining pressure effect on confined droplets by measuring droplet lubrication film thicknesses in a microfluidic Hele-Shaw cell. We find and characterize two distinct dynamical regimes, dominated respectively by capillary and intermolecular forces. In the former case rolling boundary conditions at the interface are evidenced through film thickness dynamics, interface velocity measurement and film thickness profile.

  19. All-Metal Magnetic RAM

    NASA Technical Reports Server (NTRS)

    Torok, E. J.; Spitzer, R.

    2000-01-01

    The factors that enter into the development of an all-metal, nonvolatile magnetic RAM, in which multilayer giant magnetoresistive films are used for all functions - storage, readout, and support electronics - are described. Four significant characteristics are expected to favor all-metal over hybrid magnetic RAM. First, silicon-technology fabrication requires a large number of masking steps, including complex ones such as ion implantation. Conversely, all-metal technology is inherently simple: fewer masking steps, no doping, scaling to lithographic limits, very little operating power. Second, the all-metal footprint is significantly smaller than the hybrid one. Third, an all-metal RAM is expected to be able to be miniaturized to lithographic limits; miniaturization of hybrid magnetic RAMs is likely to be limited by the semiconductor circuitry. Finally, semiconductor processing and magnetic processing in MRAM are done separately because the former requires high temperatures, whereas magnetic fabrication is a low-temperature process. By contrast, because both GMR electronics and the memory elements are made of the same materials, the two major components are deposited and patterned concurrently on the same substrate.

  20. Thick crystalline films on foreign substrates

    DOEpatents

    Smith, H.I.; Atwater, H.A.; Geis, M.W.

    1986-03-18

    To achieve a uniform texture, large crystalline grains or, in some cases, a single crystalline orientation in a thick (>1 [mu]m) film on a foreign substrate, the film is formed so as to be thin (<1 [mu]m) in a certain section. Zone-melting recrystallization is initiated in the thin section and then extended into the thick section. The method may employ planar constriction patterns of orientation filter patterns. 2 figs.

  1. Thick crystalline films on foreign substrates

    DOEpatents

    Smith, Henry I.; Atwater, Harry A.; Geis, Michael W.

    1986-01-01

    To achieve a uniform texture, large crystalline grains or, in some cases, a single crystalline orientation in a thick (>1 .mu.m) film on a foreign substrate, the film is formed so as to be thin (<1 .mu.m) in a certain section. Zone-melting recrystallization is initiated in the thin section and then extended into the thick section. The method may employ planar constriction patterns of orientation filter patterns.

  2. The spontaneous puncture of thick liquid films

    NASA Astrophysics Data System (ADS)

    Néel, Baptiste; Villermaux, Emmanuel

    2016-11-01

    We call thick those films for which the disjoining pressure is ineffective. Water films with thickness h in the 1-10 μm range are thick, but it is also known that, paradoxically, they nucleate holes spontaneously. We have uncovered a mechanism solving the paradox. Most natural films are dirty to some extent, and we show that if a spot of dissolved substance lowers locally the surface tension of the liquid, the corresponding Marangoni stress may lead to a self-sustained instability triggering film rupture. When deposited with size a, the spot dissipates by molecular diffusion (coefficient D) along the film in a time a2 / D . Before doing so, the surface tension gradient Δσ / a between the spot center (tension σ - Δσ) and the rest of the film (tension σ) induces an inhomogeneous outward interstitial flow which digs the spot, and reinforces the tension gradient. Hence the instability, which occurs within a timescale τ √{ ρa2 h / Δσ } , with ρ the liquid density. When the Péclet number Pe =a2 / Dτ is small, diffusion regularizes the film, which remains flat: clean films don't break, while for Pe > 1 , the film punctures. This new scenario will be illustrated by several experiments.

  3. Interferometry of thick and thin films

    NASA Astrophysics Data System (ADS)

    Conroy, Michael

    2007-06-01

    Interferometry is now an established technique for the measurement of surface topography. It has the capability of combining sub-nanometre resolution. A very useful extension to its capability is the ability to measure thick and thin films on a local scale. For films with thicknesses in excess of 1-2μm (depending on refractive index), the SWLI interaction with the film leads simply the formation of two localised fringes, each corresponding to a surface interface. It is relatively trivial to locate the positions of these two envelope maxima and therefore determine the film thickness, assuming the refractive index is known. For thin films (with thicknesses ~20nm to ~2μm, again depending on the index), the SWLI interaction leads to the formation of a single interference maxima. In this context, it is appropriate to describe the thin film structure in terms of optical admittances; it is this regime that is addressed through the introduction of a new function, the 'helical conjugate field' (HCF) function. This function may be considered as providing a 'signature' of the multilayer measured so that through optimization, the thin film multilayer may be determined on a local scale.

  4. Aluminum oxide film thickness and emittance

    SciTech Connect

    Thomas, J.K.; Ondrejcin, R.S.

    1991-11-01

    Aluminum reactor components which are not actively cooled could be subjected to high temperatures due to gamma heating after the core coolant level dropped during the ECS phase of a hypothetical LOCA event. Radiative heat transfer is the dominant heat transfer process in this scenario and therefore the emittance of these components is of interest. Of particular interest are the safety rod thimbles and Mark 60B blanket assemblies; for the K Reactor, these components have been exposed to low temperature (< 55{degrees}C) moderator for about a year. The average moderator temperature was assumed to be 30{degrees}C. The Al oxide film thickness at this temperature, after one year of exposure, is predicted to be 6.4 {mu}m {plus minus} 10%; insensitive to exposure time. Dehydration of the film during the gamma heating accident would result in a film thickness of 6.0 {mu}m {plus minus} 11%. Total hemispherical emittance is predicted to be 0.69 at 96{degrees}C, decreasing to 0.45 at 600{degrees}C. Some phenomena which would tend to yield thicker oxide films in the reactor environment relative to those obtained under experimental conditions were neglected and the predicted film thickness values are therefore conservative. The emittance values predicted for a given film thickness are also conservative. The conservativisms inherent in the predicted emittance are particularly relevant for uncertainty analysis of temperatures generated using these values.

  5. Aluminum oxide film thickness and emittance

    SciTech Connect

    Thomas, J.K.; Ondrejcin, R.S.

    1991-11-01

    Aluminum reactor components which are not actively cooled could be subjected to high temperatures due to gamma heating after the core coolant level dropped during the ECS phase of a hypothetical LOCA event. Radiative heat transfer is the dominant heat transfer process in this scenario and therefore the emittance of these components is of interest. Of particular interest are the safety rod thimbles and Mark 60B blanket assemblies; for the K Reactor, these components have been exposed to low temperature (< 55{degrees}C) moderator for about a year. The average moderator temperature was assumed to be 30{degrees}C. The Al oxide film thickness at this temperature, after one year of exposure, is predicted to be 6.4 {mu}m {plus_minus} 10%; insensitive to exposure time. Dehydration of the film during the gamma heating accident would result in a film thickness of 6.0 {mu}m {plus_minus} 11%. Total hemispherical emittance is predicted to be 0.69 at 96{degrees}C, decreasing to 0.45 at 600{degrees}C. Some phenomena which would tend to yield thicker oxide films in the reactor environment relative to those obtained under experimental conditions were neglected and the predicted film thickness values are therefore conservative. The emittance values predicted for a given film thickness are also conservative. The conservativisms inherent in the predicted emittance are particularly relevant for uncertainty analysis of temperatures generated using these values.

  6. Film thickness for different regimes of fluid-film lubrication

    NASA Technical Reports Server (NTRS)

    Hamrock, B. J.

    1980-01-01

    Film thickness equations are provided for four fluid-film lubrication regimes found in elliptical contacts. These regimes are isoviscous-rigid; viscous-rigid; elastohydrodynamic lubrication of low-elastic-modulus materials (soft EHL), or isoviscous-elastic; and elastohydrodynamic lubrication of high-elastic-modulus materials (hard EHL), or viscous-elastic. The influence or lack of influence of elastic and viscous effects is the factor that distinguishes these regimes. The results are presented as a map of the lubrication regimes, with film thickness contours on a log-log grid of the viscosity and elasticity for three values of the ellipticity parameter.

  7. Nano-Hydroxyapatite Thick Film Gas Sensors

    SciTech Connect

    Khairnar, Rajendra S.; Mene, Ravindra U.; Munde, Shivaji G.; Mahabole, Megha P.

    2011-12-10

    In the present work pure and metal ions (Co and Fe) doped hydroxyapatite (HAp) thick films have been successfully utilized to improve the structural, morphological and gas sensing properties. Nanocrystalline HAp powder is synthesized by wet chemical precipitation route, and ion exchange process is employed for addition of Co and Fe ions in HAp matrix. Moreover, swift heavy ion irradiation (SHI) technique is used to modify the surface of pure and metal ion exchanged HAp with various ion fluence. The structural investigation of pure and metal ion exchanged HAp thick films are carried out using X-ray diffraction and the presence of functional group is observed by means FTIR spectroscopy. Furthermore, surface morphology is visualized by means of SEM and AFM analysis. CO gas sensing study is carried out for, pure and metal ions doped, HAp thick films with detail investigation on operating temperature, response/recovery time and gas uptake capacity. The surface modifications of sensor matrix by SHI enhance the gas response, response/recovery and gas uptake capacity. The significant observation is here to note that, addition of Co and Fe in HAp matrix and surface modification by SHI improves the sensing properties of HAp films drastically resulting in gas sensing at relatively lower temperatures.

  8. Percolation effect in thick film superconductors

    SciTech Connect

    Sali, R.; Harsanyi, G.

    1994-12-31

    A thick film superconductor paste has been developed to study the properties of granulated superconductor materials, to observe the percolation effect and to confirm the theory of the conducting mechanism in the superconducting thick films. This paste was also applied to make a superconducting planar transformer. Due to high T{sub c} and advantageous current density properties the base of the paste was chosen to be of Bi(Pb)SrCaCuO system. For contacts a conventional Ag/Pt paste was used. The critical temperature of the samples were between 110 K and 115 K depending on the printed layer thickness. The critical current density at the boiling temperature of the liquid He- was between 200-300 A/cm{sup 2}. The R(T) and V(I) functions were measured with different parameters. The results of the measurements have confirmed the theory of conducting mechanism in the material. The percolation structure model has been built and described. As an application, a superconducting planar thick film transformer was planned and produced. Ten windings of the transformer were printed on one side of the alumina substrate and one winding was printed on the other side. The coupling between the two sides was possible through the substrate. The samples did not need special drying and firing parameters. After the preparation, the properties of the transformer were measured. The efficiency and the losses were determined. Finally, some fundamental advantages and problems of the process were discussed.

  9. Properties of conductive thick-film inks

    NASA Technical Reports Server (NTRS)

    Holtze, R. F.

    1972-01-01

    Ten different conductive inks used in the fabrication of thick-film circuits were evaluated for their physical and handling properties. Viscosity, solid contents, and spectrographic analysis of the unfired inks were determined. Inks were screened on ceramic substrates and fired for varying times at specified temperatures. Selected substrates were given additional firings to simulate the heat exposure received if thick-film resistors were to be added to the same substrate. Data are presented covering the (1) printing characteristics, (2) solderability using Sn-63 and also a 4 percent silver solder, (3) leach resistance, (4) solder adhesion, and (5) wire bonding properties. Results obtained using different firing schedules were compared. A comparison was made between the various inks showing general results obtained for each ink. The changes in firing time or the application of a simulated resistor firing had little effect on the properties of most inks.

  10. Development of an all-metal thick-film cost-effective metallization system for solar cells

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1981-01-01

    Screened electrodes made from fluorocarbon activated copper paste and silver fluoride activated copper paste, tape adhesion and scratch tests were studied. Experiments were conducted with variations in past parameters, firing conditions, including gas ambients, furnace furniture, silicon surface and others. A liquid medium intended to provide transport during the carbon fluoride decomposition, is incorporated in the paste.

  11. Epitaxial thick film high-Tc SQUIDs

    NASA Astrophysics Data System (ADS)

    Faley, M. I.; Mi, S. B.; Jia, C. L.; Poppe, U.; Urban, K.; Fagaly, R. L.

    2008-02-01

    Low-noise operation of superconducting quantum interference devices (SQUIDs) in magnetic fields requires high critical current and strong pinning of vortices in the superconducting electrodes and in the flux transformer. Crack-free epitaxial high-Tc dc-SQUID structures with a total thickness ?5 μm and a surface roughness determined by 30 nm high growth spirals were prepared with YBa2Cu3O7-x (YBCO) films on MgO substrates buffered by a SrTiO3/BaZrO3-bilayer. HRTEM demonstrated a high quality epitaxial growth of the films. The YBCO films and SQUID structures deposited on the buffered MgO substrates had a superconducting transition temperature Tc exceeding 91 K and critical current densities Jc > 3 MA/cm2 at 77 K up to a thickness ~5 μm. The application of thicker superconducting and insulator films helped us to increase the critical current and dynamic range of the multilayer high-Tc flux transformer and improve the insulation between the superconducting layers. An optimization of SQUID inductance allowed us to fabricate 8 mm SQUID magnetometers with SQUID voltage swings of ~60 μV and a field resolution of ~30 fT/√Hz at 77 K.

  12. Residual Stress Analysis in Thick Uranium Films

    SciTech Connect

    Hodge, A M; Foreman, R J; Gallegos, G F

    2004-12-06

    Residual stress analysis was performed on thick, 1.0 to 25 {micro}m, depleted Uranium (DU) films deposited on an Al substrate by magnetron sputtering. Two distinct characterization techniques were used to measure substrate curvature before and after deposition. Stress evaluation was performed using the Benabdi/Roche equation, which is based on beam theory of a bi-layer material. The residual stress evolution was studied as a function of coating thickness and applied negative bias voltage (0-300V). The stresses developed were always compressive; however, increasing the coating thickness and applying a bias voltage presented a trend towards more tensile stresses and thus an overall reduction of residual stresses.

  13. Thick Films: Electronic Applications. (Latest citations from the Aerospace Database)

    NASA Technical Reports Server (NTRS)

    1996-01-01

    The bibliography contains citations concerning the design, development, fabrication, and evaluation of thick film electronic devices. Thick film solar cells, thick films for radiation conduction, deposition processes, conductive inks are among the topics discussed. Applications in military and civilian avionics are examined.

  14. The influence of binder film thickness on the mechanical properties of binder films in tension.

    PubMed

    Ononokpono, O E; Spring, M S

    1988-02-01

    The physicomechanical properties of films of different thicknesses, made from methylcellulose and gelatinized maize starch, have been studied in tension. There was a linear relation between film thickness and tensile strength, toughness, elastic resilence and elongation at fracture. Young's modulus increased with decreasing film thickness particularly with films with a thickness of less than 15 micron.

  15. New materials for thick-film electronics

    SciTech Connect

    Hoffheins, B.S.; Lauf, R.J.

    1990-08-01

    Certain ceramic compounds such as rare-earth perovskites and transition-metal diborides that exhibit metallic conductivity are readily available or can be easily synthesized. Some are stable in air firing temperatures typical of hybrid-circuit processing. The work described is part of an exploratory program to determine whether these materials can be used as low-cost alternatives to precious metals for thick-film conductor and low-resistor inks or as substitutes for copper in nitrogen-fireable compositions. 8 refs., 13 figs., 3 tabs.

  16. Method for preparing a thick film conductor

    DOEpatents

    Nagesh, Voddarahalli K.; Fulrath, deceased, Richard M.

    1978-01-01

    A method for preparing a thick film conductor which comprises providing surface active glass particles, mixing the surface active glass particles with a thermally decomposable organometallic compound, for example, a silver resinate, and then decomposing the organometallic compound by heating, thereby chemically depositing metal on the glass particles. The glass particle mixture is applied to a suitable substrate either before or after the organometallic compound is thermally decomposed. The resulting system is then fired in an oxidizing atmosphere, providing a microstructure of glass particles substantially uniformly coated with metal.

  17. Thick film traps with an irregular film. Preparation and evaluation.

    PubMed

    Kloskowski, Adam; Pettersson, Johan; Roeraade, Johan

    2004-05-07

    A new method for preparation of sorbent-based ultra-thick film traps for concentration of trace volatile components from gaseous matrices is described. The procedure is based on blowing a prepolymer (polydimethylsiloxane) through a capillary tube, forming an irregular film of stationary phase. Subsequently, the prepolymer is immobilized in a few seconds by heating to 200 degrees C. Evaluation of the performance of the new traps showed that the loss of efficiency, compared to regular smooth film traps is only on the order of 20-30%. In terms of breakthrough volume, this loss in performance is rather insignificant. The technology is extremely simple and allows a rapid and cheap production of a large number of ultra-thick film traps, even in non-specialized laboratories. The method can be applied to any type of cross-linkable stationary phase, thereby expanding the scope of sorbent-based trapping and preconcentration concept. Many applications are anticipated in trace and ultra-trace analysis in a wide range of fields, such as environmental chemistry, polymers, food and process analysis.

  18. [Study on plastic film thickness measurement by integral spectrum method].

    PubMed

    Qiu, Chao; Sun, Xiao-Gang

    2013-01-01

    Band integral transmission was defined and plastic film thickness measurement model was built by analyzing the intensity variation when the light passes plastic film, after the concept of band Lambert Law was proposed. Polypropylene film samples with different thickness were taken as the research object, and their spectral transmission was measured by the spectrometer. The relationship between thickness and band integral transmission is fitted using the model mentioned before. The feasibility of developing new broad band plastic film thickness on-line measurement system based on this method was analysed employing the ideal blackbody at temperature of 500 K. The experimental results indicate that plastic film thickness will be measured accurately by integral spectrum method. Plastic film thickness on-line measurement system based on this method will hopefully solve the problems of that based on dual monochromatic light contrast method, such as low accuracy, poor universality and so on.

  19. Scalable Thick-Film Magnetics: Nano Structured Scalable Thick-Film Magnetics

    SciTech Connect

    2011-01-01

    ADEPT Project: Magnetic components are typically the largest components in a power converter. To date, however, researchers haven't found an effective way to reduce their size without negatively impacting their performance. And, reducing the size of the converter's other components isn't usually an option because shrinking them can also diminish the effectiveness of the magnetic components. GE is developing smaller magnetic components for power converters that maintain high performance levels. The company is building smaller components with magnetic films. These films are created using the condensation of a vaporized form of the magnetic material. It's a purely physical process that involves no chemical reactions, so the film composition is uniform. This process makes it possible to create a millimeter-thick film deposition over a wide surface area fairly quickly, which would save on manufacturing costs. In fact, GE can produce 1-10 millimeter-thick films in hours. The magnetic components that GE is developing for this project could be used in a variety of applications, including solar inverters, electric vehicles, and lighting.

  20. Multiplexed Holographic Optical Data Storage In Thick Bacteriorhodopsin Films

    NASA Technical Reports Server (NTRS)

    Downie, John D.; Timucin, Dogan A.; Gary, Charles K.; Ozcan, Meric; Smithey, Daniel T.; Crew, Marshall

    1998-01-01

    The optical data storage capacity of photochromic bacteriorhodopsin films is investigated by means of theoretical calculations, numerical simulations, and experimental measurements on sequential recording of angularly multiplexed diffraction gratings inside a thick D85N BR film.

  1. Measurement of dielectric-film thickness at low density plasma

    NASA Astrophysics Data System (ADS)

    Jeon, Sang-Bum; Kim, Dong-Hwan; Kim, Jin-Yong; Paek, Se-Yeol; Chung, Chin-Wook

    2016-09-01

    The measurement system of dielectric-film thickness was improved to measure thin-film at low density plasma. There are three improvements than previous method, which is electrical measurement of dielectric-film thickness using R-C sheath model. First, the frequency of input voltage was decreased to reduce the ratio of the dielectric-film impedance to sheath impedance. Second, three different frequencies were used to overcome the inaccuracy of measured phase; only amplitudes of measured current were used to obtain a film thickness. Third, the notch filter was used for sensing current instead of the resistor to improve the signal to noise ratio. Using this method, dielectric-film thickness was well measured at low density plasma (thickness: 300, sheath impedance: 100 200 k Ω) .

  2. Preparation of Thick Magnet Films by the Aerosol Deposition Method

    NASA Astrophysics Data System (ADS)

    Sugimoto, Satoshi

    The aerosol deposition method (ADM) is effective for the preparation of thick films with high deposition rate. We applied this method to fabricate NiZn ferrite or Sm-Fe-N films, which are used for microwave absorbers or permanent magnets, respectively. In this article, the magnetic properties of Sm-Fe-N thick films fabricated by the ADM are introduced and the possibility of the ADM for the fabrication process with high deposition rate is discussed.

  3. Droplet-air collision dynamics: Evolution of the film thickness

    NASA Astrophysics Data System (ADS)

    Opfer, L.; Roisman, I. V.; Venzmer, J.; Klostermann, M.; Tropea, C.

    2014-01-01

    This study is devoted to the experimental and theoretical investigation of aerodynamic drop breakup phenomena. We show that the phenomena of drop impact onto a rigid wall, drop binary collisions, and aerodynamic drop deformation are similar if the correct scaling is applied. Then we use observations of the deforming drop to estimate the evolution of the film thickness of the bag, the value that determines the size of the fine child drops produced by bag breakup. This prediction of film thickness, based on film kinematics, is validated for the initial stage by direct drop thickness measurements and at the latest stage by the data obtained from the velocity of hole expansion in the film. It is shown that the film thickness correlates well with the dimensionless position of the bag apex.

  4. Integrated thick-film nanostructures based on spinel ceramics

    PubMed Central

    2014-01-01

    Integrated temperature-humidity-sensitive thick-film structures based on spinel-type semiconducting ceramics of different chemical compositions and magnesium aluminate ceramics were prepared and studied. It is shown that temperature-sensitive thick-film structures possess good electrophysical characteristics in the region from 298 to 358 K. The change of electrical resistance in integrated thick-film structures is 1 order, but these elements are stable in time and can be successfully used for sensor applications. PMID:24670141

  5. Laser triangulation for liquid film thickness measurements through multiple interfaces.

    PubMed

    Peterson, Jerrod P; Peterson, Richard B

    2006-07-10

    Laser triangulation is used to measure the thickness of a liquid film in a test section consisting of a quartz viewing window, a water layer, and a hydrophobic membrane. The triangulation sensor acquires measurements to the bounding surfaces of the film while peering through multiple interfaces. This allows the difference between the two measurements to constitute the local film thickness. A refraction model is developed and applied to the analysis of data collected from the experiment. For verification, an empirical method is also developed and compared to the analytical approach. The measurement technique is intended to assess the stability of liquid films for use as gas-liquid contactors.

  6. Liquid film thickness measurement by two-line TDLAS

    SciTech Connect

    Yang, Huinan; Chen, Jun; Cai, Xiaoshu; Greszik, Daniel; Dreier, Thomas; Schulz, Christof

    2014-04-11

    A fiber-based two-line tunable diode-laser absorption sensor with two near-infrared (NIR) distributed-feedback (DFB) diode lasers at ∼1.4 μm was used for non-intrusive time-resolved liquid water film thickness measurement. When probing the liquid film at two different wavelengths with significantly different absorption cross-sections, the additional signal losses due to surface fowling, reflection and beam steering can be eliminated. In this work, the evaporation process of a liquid film on transparent quartz plate was tracked and large fluctuations of film thickness were found at the end of the evaporation.

  7. Absolute Measurements of Radiation Damage in Nanometer Thick Films

    PubMed Central

    Alizadeh, Elahe; Sanche, Léon

    2013-01-01

    We address the problem of absolute measurements of radiation damage in films of nanometer thicknesses. Thin films of DNA (~ 2–160nm) are deposited onto glass substrates and irradiated with varying doses of 1.5 keV X-rays under dry N2 at atmospheric pressure and room temperature. For each different thickness, the damage is assessed by measuring the loss of the supercoiled configuration as a function of incident photon fluence. From the exposure curves, the G-values are deduced, assuming that X-ray photons interacting with DNA, deposit all of their energy in the film. The results show that the G-value (i.e., damage per unit of deposited energy) increases with film thickness and reaches a plateau at 30±5 nm. This thickness dependence provides a correction factor to estimate the actual G-value for films with thicknesses below 30nm thickness. Thus, the absolute values of damage can be compared with that of films of any thickness under different experimental conditions. PMID:22562941

  8. Critical thickness for the agglomeration of thin metal films

    SciTech Connect

    Boragno, C.; Buatier de Mongeot, F.; Felici, R.; Robinson, I.K.

    2009-09-15

    A thin metal film can exist in a metastable state with respect to breaking into small clusters. In this paper we report on grazing incidence small-angle x-ray scattering studies carried out in situ during the annealing of thin Ni films, between 2 and 10 nm thick, deposited on an amorphous SiO{sub 2} substrate. Our results show the presence of two different regimes which depend on the initial film thickness. For thicknesses less than 5 nm the annealing results in the formation of small, compact clusters on top of a residual Ni wetting layer. For thicknesses greater than 5 nm the film breaks into large, well-separated clusters and the substrate shows an uncovered clean surface.

  9. Microfluidic devices with thick-film electrochemical detection

    DOEpatents

    Wang, Joseph; Tian, Baomin; Sahlin, Eskil

    2005-04-12

    An apparatus for conducting a microfluidic process and analysis, including at least one elongated microfluidic channel, fluidic transport means for transport of fluids through the microfluidic channel, and at least one thick-film electrode in fluidic connection with the outlet end of the microfluidic channel. The present invention includes an integrated on-chip combination reaction, separation and thick-film electrochemical detection microsystem, for use in detection of a wide range of analytes, and methods for the use thereof.

  10. Thickness-dependent spontaneous dewetting morphology of ultrathin Ag films.

    PubMed

    Krishna, H; Sachan, R; Strader, J; Favazza, C; Khenner, M; Kalyanaraman, R

    2010-04-16

    We show here that the morphological pathway of spontaneous dewetting of ultrathin Ag films on SiO2 under nanosecond laser melting is dependent on film thickness. For films with thickness h of 2 nm < or = h < or = 9.5 nm, the morphology during the intermediate stages of dewetting consisted of bicontinuous structures. For films with 11.5 nm < or = h < or = 20 nm, the intermediate stages consisted of regularly sized holes. Measurement of the characteristic length scales for different stages of dewetting as a function of film thickness showed a systematic increase, which is consistent with the spinodal dewetting instability over the entire thickness range investigated. This change in morphology with thickness is consistent with observations made previously for polymer films (Sharma and Khanna 1998 Phys. Rev. Lett. 81 3463-6; Seemann et al 2001 J. Phys.: Condens. Matter 13 4925-38). Based on the behavior of free energy curvature that incorporates intermolecular forces, we have estimated the morphological transition thickness for the intermolecular forces for Ag on SiO2. The theory predictions agree well with observations for Ag. These results show that it is possible to form a variety of complex Ag nanomorphologies in a consistent manner, which could be useful in optical applications of Ag surfaces, such as in surface enhanced Raman sensing.

  11. Interferometric measurement method of thin film thickness based on FFT

    NASA Astrophysics Data System (ADS)

    Shuai, Gaolong; Su, Junhong; Yang, Lihong; Xu, Junqi

    2009-05-01

    The kernel of modern interferometry is to obtain necessary surface shape and parameter by processing interferogram with reasonable algorithm. The paper studies the basic principle of interferometry involving 2-D FFT, proposes a new method for measuring thin film thickness based on FFT: by CCD receiving and acquired card collecting with the help of Twyman-Green interferometer, can a fringe interferogram of the measured thin film be obtained. Based on the interferogram processing knowledge, an algorithm processing software/program can be prepared to realize identification of the edge films, regional extension, filtering, unwrapping the wrapped phase etc. And in this way can the distribution of film information-coated surface be obtained and the thickness of thin film samples automatically measured. The findings indicate the PV value and RMS value of the measured film samples are 0.256 λ and 0.068 λ respectively and prove the new method has high precision.

  12. Thick, low-stress films, and coated substrates formed therefrom

    DOEpatents

    Henager, Jr., Charles H.; Knoll, Robert W.

    1991-01-01

    Stress-induced deformation, and the damage resulting therefrom, increases with film thickness. The overcoming of excessive stress by the use of the film material of the present invention, permits the formation of thick films that are necessary for certain of the above described applications. The most likely use for the subject film materials, other than their specialized views as an optical film, is for microelectronic packaging of components on silicon substrates. In general, the subject Si-Al-O-N films have excellent adherence to the underlying substrate, a high degree of hardness and durability, and are excellent insulators. Prior art elevated temperature deposition processes cannot meet the microelectronic packaging temperature formation constraints. The process of the present invention is conducted under non-elevated temperature conditions, typically 500# C. or less.

  13. Traction and film thickness measurements under starved elastohydrodynamic conditions

    NASA Technical Reports Server (NTRS)

    Wedeven, L. D.

    1974-01-01

    Traction measurements under starved elastohydrodynamic conditions were obtained for a point contact geometry. Simultaneous measurements of the film thickness and the locations of the inlet lubricant boundary were made optically. The thickness of a starved film for combination rolling and sliding conditions varies with the location of the inlet boundary in the same way found previously for pure rolling. A starved film was observed to possess greater traction than a flooded film for the same slide roll ratio. For a given slide roll ratio a starved film simply increases the shear rate in the Hertz region. The maximum shear rate depends on the degree of starvation and has no theoretical limit. Traction measurements under starved conditions were compared with flooded conditions under equivalent shear rates in the Hertz region. When the shear rates in the Hertz region were low and the film severely starved, the measured tractions were found to be much lower than expected.

  14. Method of measuring the thickness of radioactive thin films

    NASA Technical Reports Server (NTRS)

    Alger, D. L.; Steinberg, R.; Makinen, M. D.

    1974-01-01

    Thickness monitor consists of proportional X-ray counter coupled to pulse counting system, copper filter over face of counter, rotatable collimator containing radioactive source, and rotatable shutter. Monitor can be used as integral part of neutron generator. It has been used to measure titanium tritide film thicknesses from 0.1 to 30 micrometers.

  15. The Slate all metal airship

    NASA Technical Reports Server (NTRS)

    Slate, C. C.; Neumann, R. D.

    1975-01-01

    The development of the Slate all metal airship City of Glendale built and completed in 1930 is presented. The airship facilities are discussed. Pertinent data which led to other engineering accomplishments for aviation are shown. The SMD-100 concept is presented along with a brief commentary on the costs and problems involved in such an airship design and the application of the hoisting and elevator facilities to airship development.

  16. Thermal transport across a substrate-thin-film interface: effects of film thickness and surface roughness.

    PubMed

    Liang, Zhi; Sasikumar, Kiran; Keblinski, Pawel

    2014-08-08

    Using molecular dynamics simulations and a model AlN-GaN interface, we demonstrate that the interfacial thermal resistance R(K) (Kapitza resistance) between a substrate and thin film depends on the thickness of the film and the film surface roughness when the phonon mean free path is larger than film thickness. In particular, when the film (external) surface is atomistically smooth, phonons transmitted from the substrate can travel ballistically in the thin film, be scattered specularly at the surface, and return to the substrate without energy transfer. If the external surface scatters phonons diffusely, which is characteristic of rough surfaces, R(K) is independent of film thickness and is the same as R(K) that characterizes smooth surfaces in the limit of large film thickness. At interfaces where phonon transmission coefficients are low, the thickness dependence is greatly diminished regardless of the nature of surface scattering. The film thickness dependence of R(K) is analogous to the well-known fact of lateral thermal conductivity thickness dependence in thin films. The difference is that phonon-boundary scattering lowers the in-plane thermal transport in thin films, but it facilitates thermal transport from the substrate to the thin film.

  17. Ultra-thick, low-stress nanostructured diamond films

    SciTech Connect

    Kucheyev, S O; Biener, J; Tringe, J W; Wang, Y M

    2005-01-13

    We describe a hot-filament chemical vapor deposition process for growing freestanding nanostructured diamond films, {approx}80 {micro}m thick, with residual tensile stress levels {le} 90 MPa. We characterize the film microstructure, mechanical properties, chemical bond distribution, and elemental composition. Results show that our films are nanostructured with columnar grain diameters of {le} 150 nm and a highly variable grain length along the growth direction of {approx}50-1500 nm. These films have a rms surface roughness of {le} 200 nm for a 300 x 400 {micro}m{sup 2} scan, which is about one order of magnitude lower than the roughness of typical microcrystalline diamond films of comparable thickness. Soft x-ray absorption near-edge structure (XANES) spectroscopy indicates a large percentage of sp{sup 3} bonding in the films,consistent with a high hardness of 66 GPa. Nanoindentation and XANES results are also consistent with a high phase and elemental purity of the films, directly measured by x-ray and electron diffraction, Rutherford backscattering spectrometry, and elastic recoil detection analysis. Cross-sectional transmission electron microscopy reveals a large density of planar defects within the grains, suggesting a high rate of secondary nucleation during film growth. These films represent a new class of smooth, ultra-thick nanostructured diamond.

  18. Effect of Temperature Gradient on Thick Film Selective Emitter Emittance

    NASA Technical Reports Server (NTRS)

    Chubb, Donald L.; Good, Brian S.; Clark, Eric B.; Chen, Zheng

    1997-01-01

    A temperature gradient across a thick (greater than or equal to .1 mm) film selective emitter will produce a significant reduction in the spectral emittance from the no temperature gradient case. Thick film selective emitters of rare earth doped host materials such as yttrium-aluminum-garnet (YAG) are examples where temperature gradient effects are important. In this paper a model is developed for the spectral emittance assuming a linear temperature gradient across the film. Results of the model indicate that temperature gradients will result in reductions the order of 20% or more in the spectral emittance.

  19. Glue Film Thickness Measurements by Spectral Reflectance

    SciTech Connect

    B. R. Marshall

    2010-09-20

    Spectral reflectance was used to determine the thickness of thin glue layers in a study of the effect of the glue on radiance and reflectance measurements of shocked-tin substrates attached to lithium fluoride windows. Measurements based on profilometry of the components were found to be inaccurate due to flatness variations and deformation of the tin substrate under pressure during the gluing process. The accuracy of the spectral reflectance measurements were estimated to be ±0.5 μm, which was sufficient to demonstrate a convincing correlation between glue thickness and shock-generated light.

  20. Development of the nitride film thickness standard (NFTS)

    NASA Astrophysics Data System (ADS)

    Durga Pal, Prabha

    1998-07-01

    The semiconductor industry has been demanding film thickness reference material for films other than thermally grown silicon dioxide for sometime. To meet this challenge, Nitride Film Thickness Standard (NFTS) has been developed in four nominal thickness values, 20.0 nm, 90.0 nm, 120.0 nm and 200.0 nm. These are silicon nitride (Si3N4) films on silicon crystal substrate. Work is underway to develop a 9.0 nm standard. Thin nitride films are particularly needed for calibration of the thickness of nitride layers in capacitors and isolation masks for LOCOS (local oxidation of silicon). The reference material is certified for derived film thickness. The study consists of measurements made on four different sets of wafers that included patterned and unpatterned wafers. The measurements made on these wafer sets were used for answering issues related to film stability and cleaning. The stability study includes the search for a cleaning process that will restore a prior surface condition. On two sets of wafers two different types of cleaning procedures were used. Results indicate that a sulfuric acidmegasonic clean will etch the nitride film while an isopropyl alcohol clean followed by a deionized water rinse can be used over and over again. The third set of wafers was never cleaned and measurements were made on these over a period of two years. The last set of wafers is patterned. These are cleaned prior to measurement. Results show that LPCVD silicon nitride films are stable and can be used with confidence over a long period of time for calibrating optical metrology instruments.

  1. Thickness of residual wetting film in liquid-liquid displacement.

    PubMed

    Beresnev, Igor; Gaul, William; Vigil, R Dennis

    2011-08-01

    Core-annular flow is common in nature, representing, for example, how streams of oil, surrounded by water, move in petroleum reservoirs. Oil, typically a nonwetting fluid, tends to occupy the middle (core) part of a channel, while water forms a surrounding wall-wetting film. What is the thickness of the wetting film? A classic theory has been in existence for nearly 50 years offering a solution, although in a controversial manner, for moving gas bubbles. On the other hand, an acceptable, experimentally verified theory for a body of one liquid flowing in another has not been available. Here we develop a hydrodynamic, testable theory providing an explicit relationship between the thickness of the wetting film and fluid properties for a blob of one fluid moving in another, with neither phase being gas. In its relationship to the capillary number Ca, the thickness of the film is predicted to be proportional to Ca2 at lower Ca and to level off at a constant value of ∼20% the channel radius at higher Ca. The thickness of the film is deduced to be approximately unaffected by the viscosity ratio of the fluids. We have conducted our own laboratory experiments and compiled experimental data from other studies, all of which are mutually consistent and confirm the salient features of the theory. At the same time, the classic law, originally deduced for films surrounding moving gas bubbles but often believed to hold for liquids as well, fails to explain the observations.

  2. Thickness of residual wetting film in liquid-liquid displacement

    NASA Astrophysics Data System (ADS)

    Beresnev, Igor; Gaul, William; Vigil, R. Dennis

    2011-08-01

    Core-annular flow is common in nature, representing, for example, how streams of oil, surrounded by water, move in petroleum reservoirs. Oil, typically a nonwetting fluid, tends to occupy the middle (core) part of a channel, while water forms a surrounding wall-wetting film. What is the thickness of the wetting film? A classic theory has been in existence for nearly 50 years offering a solution, although in a controversial manner, for moving gas bubbles. On the other hand, an acceptable, experimentally verified theory for a body of one liquid flowing in another has not been available. Here we develop a hydrodynamic, testable theory providing an explicit relationship between the thickness of the wetting film and fluid properties for a blob of one fluid moving in another, with neither phase being gas. In its relationship to the capillary number Ca, the thickness of the film is predicted to be proportional to Ca2 at lower Ca and to level off at a constant value of ˜20% the channel radius at higher Ca. The thickness of the film is deduced to be approximately unaffected by the viscosity ratio of the fluids. We have conducted our own laboratory experiments and compiled experimental data from other studies, all of which are mutually consistent and confirm the salient features of the theory. At the same time, the classic law, originally deduced for films surrounding moving gas bubbles but often believed to hold for liquids as well, fails to explain the observations.

  3. Thick-film materials for silicon photovoltaic cell manufacture

    NASA Technical Reports Server (NTRS)

    Field, M. B.

    1977-01-01

    Thick film technology is applicable to three areas of silicon solar cell fabrication; metallization, junction formation, and coating for protection of screened ohmic contacts, particularly wrap around contacts, interconnection and environmental protection. Both material and process parameters were investigated. Printed ohmic contacts on n- and p-type silicon are very sensitive to the processing parameters of firing time, temperature, and atmosphere. Wrap around contacts are easily achieved by first printing and firing a dielectric over the edge and subsequently applying a low firing temperature conductor. Interconnection of cells into arrays can be achieved by printing and cofiring thick film metal pastes, soldering, or with heat curing conductive epoxies on low cost substrates. Printed (thick) film vitreous protection coatings do not yet offer sufficient optical uniformity and transparency for use on silicon. A sprayed, heat curable SiO2 based resin shows promise of providing both optical matching and environmental protection.

  4. Lubricant limiting shear stress effect on EHD film thickness

    NASA Technical Reports Server (NTRS)

    Gecim, B.; Winer, W. O.

    1979-01-01

    A Grubin-like EHD inlet analysis utilizing a non-linear viscous fluid model with a limiting shear stress is reported. The shear rheological equation requirs only a low shear stress viscosity and the limiting shear stress both functions of pressure. Values employed for these properties are taken from measurements on typical lubricants. Reductions of EHD film thickness are found to be up to 40 percent compared with the standard Grubin prediction for typical operating conditions. Slide-roll ratio, limiting shear stress dependence on pressure, and atmospheric pressure value of limiting shear stress are new variables required to determine film thickness with the first two being more important than the last. The EHD film thickness is reduced by increasing slide-roll ratio and/or decreasing the pressure dependence of the limiting shear stress.

  5. Turbulence in Flowing Soap Films: Velocity, Vorticity, and Thickness Fields

    SciTech Connect

    Rivera, M.; Vorobieff, P.; Ecke, R.E.

    1998-08-01

    We report experimental measurements of the velocity, vorticity, and thickness fields of turbulent flowing soap films using a modified particle-image velocimetry technique. These data yield the turbulent energy and enstrophy of the two-dimensional flows with microscale Reynolds numbers of about 100 and demonstrate the effects of compressibility arising from variations in film thickness. Despite the compressibility of the flow, real-space correlations of velocity, vorticity, and enstrophy flux are consistent with theoretical predictions for two-dimensional turbulence. {copyright} {ital 1998} {ital The American Physical Society }

  6. Process for manufacture of thick film hydrogen sensors

    DOEpatents

    Perdieu, Louisa H.

    2000-09-09

    A thick film process for producing hydrogen sensors capable of sensing down to a one percent concentration of hydrogen in carrier gasses such as argon, nitrogen, and air. The sensor is also suitable to detect hydrogen gas while immersed in transformer oil. The sensor includes a palladium resistance network thick film printed on a substrate, a portion of which network is coated with a protective hydrogen barrier. The process utilizes a sequence of printing of the requisite materials on a non-conductive substrate with firing temperatures at each step which are less than or equal to the temperature at the previous step.

  7. Effects of particle size distribution in thick film conductors

    NASA Technical Reports Server (NTRS)

    Vest, R. W.

    1983-01-01

    Studies of particle size distribution in thick film conductors are discussed. The distribution of particle sizes does have an effect on fired film density but the effect is not always positive. A proper distribution of sizes is necessary, and while the theoretical models can serve as guides to selecting this proper distribution, improved densities can be achieved by empirical variations from the predictions of the models.

  8. Film thickness frequency distribution of different vehicles determines sunscreen efficacy.

    PubMed

    Sohn, Myriam; Hêche, Adeline; Herzog, Bernd; Imanidis, Georgios

    2014-11-01

    Sun protection factor (SPF) frequently differs between sunscreens containing the same composition of ultraviolet (UV) filters that primarily define sunscreen efficacy. We tested the hypothesis that the thickness frequency distribution of the sunscreen film is also responsible for and can explain the divergence in the measured SPF. For this, we developed a method to measure film thickness from the difference of topography before and after application of of sunscreen on pig ear epidermal membrane. The influence of five vehicle formulations and of application pressure and spreading time on mean thickness ( ), to median ratio, and SPF in vitro was investigated. The vehicle had a significant impact, low vehicle viscosity resulting in a smaller , larger to median ratio, and lower SPF in vitro than high viscosity; continuous oil phase produced the largest and SPF values. A long spreading time reduced and SPF and increased application pressure reduced SPF. There was a positive correlation between and SPF in vitro, underlining the relevance of film thickness for interpreting UV protection differences of formulations with the same filter composition. This work demonstrated a strong influence of vehicle and application conditions on sunscreen efficacy arising from differences in film thickness distribution.

  9. Film thickness frequency distribution of different vehicles determines sunscreen efficacy

    NASA Astrophysics Data System (ADS)

    Sohn, Myriam; Hêche, Adeline; Herzog, Bernd; Imanidis, Georgios

    2014-11-01

    Sun protection factor (SPF) frequently differs between sunscreens containing the same composition of ultraviolet (UV) filters that primarily define sunscreen efficacy. We tested the hypothesis that the thickness frequency distribution of the sunscreen film is also responsible for and can explain the divergence in the measured SPF. For this, we developed a method to measure film thickness from the difference of topography before and after application of 2 mg/cm2 of sunscreen on pig ear epidermal membrane. The influence of five vehicle formulations and of application pressure and spreading time on mean thickness (S), S to median ratio, and SPF in vitro was investigated. The vehicle had a significant impact, low vehicle viscosity resulting in a smaller S, larger S to median ratio, and lower SPF in vitro than high viscosity; continuous oil phase produced the largest S and SPF values. A long spreading time reduced S and SPF and increased application pressure reduced SPF. There was a positive correlation between S and SPF in vitro, underlining the relevance of film thickness for interpreting UV protection differences of formulations with the same filter composition. This work demonstrated a strong influence of vehicle and application conditions on sunscreen efficacy arising from differences in film thickness distribution.

  10. Thin dielectric film thickness determination by advanced transmission electron microscopy

    SciTech Connect

    Diebold, A.C.; Foran, B.; Kisielowski, C.; Muller, D.; Pennycook, S.; Principe, E.; Stemmer, S.

    2003-09-01

    High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by non-specialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annular dark field detectors for scanning TEM (STEM). With the recent development of reliable lattice image processing software that creates crystal structure images from phase contrast data, HR-TEM can also provide crystal lattice images. The resolution of both methods was steadily improved reaching now into the sub Angstrom region. Improvements in electron lens and image analysis software are increasing the spatial resolution of both methods. Optimum resolution for STEM requires that the probe beam be highly localized. In STEM, beam localization is enhanced by selection of the correct aperture. When STEM measurement is done using a highly localized probe beam, HR-TEM and STEM measurement of the thickness of silicon oxynitride films agree within experimental error. In this paper, the optimum conditions for HR-TEM and STEM measurement are discussed along with a method for repeatable film thickness determination. The impact of sample thickness is also discussed. The key result in this paper is the proposal of a reproducible method for film thickness determination.

  11. Application of white light Fresnel diffractometry to film thickness measurement.

    PubMed

    Hassani, Khosrow; Ashrafganjoie, Mehdi; Tavassoly, Mohammad Taghi

    2016-03-01

    In this work we present the theoretical background and experimental procedure to measure the thickness of thin films by analyzing Fresnel diffraction patterns obtained from polychromatic illumination of phase-step samples. As examples of this technique, we measured the thicknesses of thin aluminum layers on glass substrates using three different broad-spectrum light sources. The results are in excellent agreement with independent interferometric measurements within less than 5% relative uncertainties.

  12. Electroplated thick-film cobalt platinum permanent magnets

    NASA Astrophysics Data System (ADS)

    Oniku, Ololade D.; Qi, Bin; Arnold, David P.

    2016-10-01

    The material and magnetic properties of multi-micron-thick (up to 6 μm) L10 CoPt magnetic films electroplated onto silicon substrates are investigated as candidate materials for integration in silicon-based microsystems. The influence of various process conditions on the structure and magnetic properties of electroplated CoPt thick-films is studied in order to better understand the complex process/structure/property relationships associated with the electroplated films. Process variables studied here include different seed layers, electroplating current densities (ranging from 25-200 mA/cm2), deposition times (up to 60 min), and post-deposition annealing times and temperatures. Analyses include film morphology, film thickness, composition, surface roughness, grain size, phase volume fractions, and L10 ordering parameter. Key correlations are found relating process and structure variations to the extrinsic magnetic properties (remanence, coercivity, squareness, and energy product). Strong hard magnetic properties (Br ~0.8 T, Hci ~800 kA/m, squareness close to 0.9, and BHmax of 100 kJ/m3) are obtained for films deposited on Si/TiN/Ti/Cu at current densities of 100 mA/cm2, pH of 7, and subsequently annealed at 675 °C for 30 min.

  13. High-throughput characterization of film thickness in thin film materials libraries by digital holographic microscopy.

    PubMed

    Lai, Yiu Wai; Krause, Michael; Savan, Alan; Thienhaus, Sigurd; Koukourakis, Nektarios; Hofmann, Martin R; Ludwig, Alfred

    2011-10-01

    A high-throughput characterization technique based on digital holography for mapping film thickness in thin-film materials libraries was developed. Digital holographic microscopy is used for fully automatic measurements of the thickness of patterned films with nanometer resolution. The method has several significant advantages over conventional stylus profilometry: it is contactless and fast, substrate bending is compensated, and the experimental setup is simple. Patterned films prepared by different combinatorial thin-film approaches were characterized to investigate and demonstrate this method. The results show that this technique is valuable for the quick, reliable and high-throughput determination of the film thickness distribution in combinatorial materials research. Importantly, it can also be applied to thin films that have been structured by shadow masking.

  14. The thickness dependence of dielectric permittivity in thin films

    NASA Astrophysics Data System (ADS)

    Starkov, Ivan A.; Starkov, Alexander S.

    2016-08-01

    It is well known that the physical properties of thin films depend on their thickness. For a description of such dependences, it is proposed to use a classical model taking into account the presence of film interfaces. A dielectric ball near the half-space was chosen to adopt the approach. The dependence of the effective permittivity of the ball on geometrical and physical parameters of the system is analyzed. It is demonstrated that the dielectric constant of a film can be presented as a sum of the constant of a bulk material and the interface term.

  15. Enhanced electrocaloric effect in composition gradient bilayer thick films

    NASA Astrophysics Data System (ADS)

    Hou, Ying; Yang, Lu; Qian, Xiaoshi; Zhang, Tian; Zhang, Q. M.

    2016-03-01

    We report the enhanced electrocaloric (EC) response over a broad temperature range in composition gradient Ba(ZrTi)O3 based bilayer thick films. A large EC temperature change of -4.9 K under an electric field of 10 MV/m around room temperature, large electrocaloric coefficient ΔT/ΔE = 0.49 × 10-6 K m V-1 were observed in the BaZr0.17Ti0.83O3/BaZr0.20Ti0.80O3 bilayer thick films, which are improved compared with BaZr0.20Ti0.80O3 and BaZr0.17Ti0.83O3 homogeneous bilayer films. The result reveals the potential of the composition gradient bilayer structure in improving the electrocaloric effect, which may provide an effective route to achieve large EC temperature change under a low electric field.

  16. Isothermal melt processing of Bi-2212 thick films

    NASA Astrophysics Data System (ADS)

    Holesinger, T. G.; Phillips, D. S.; Coulter, J. Y.; Willis, J. O.; Peterson, D. E.

    1995-02-01

    An alternative melt-processing technique has been developed for the fabrication of Bi 2Sr 2CaCu 2O y (Bi-2212) thick films at temperatures over 100°C lower than those employed in conventional Bi-2212 melt processing. Isothermal melt processing combines the melting and solidification steps at the same temperature [T.G. Holesinger et al., Appl. Phys. Lett. 63 (1993) 982]. This technique is possible due to the large drop in the solidus temperature with decreasing oxygen partial pressure. High-quality thick films were processed at temperatures as low as 770°C. Such films were found to be well-textured, contain relatively few secondary phases, and possess critical current densities over 1 × 10 5 A/cm 2 at 4 K in self-field.

  17. Determination of thin hydrodynamic lubricating film thickness using dichromatic interferometry.

    PubMed

    Guo, L; Wong, P L; Guo, F; Liu, H C

    2014-09-10

    This paper introduces the application of dichromatic interferometry for the study of hydrodynamic lubrication. In conventional methods, two beams with different colors are projected consecutively on a static object. By contrast, the current method deals with hydrodynamic lubricated contacts under running conditions and two lasers with different colors are projected simultaneously to form interference images. Dichromatic interferometry incorporates the advantages of monochromatic and chromatic interferometry, which are widely used in lubrication research. This new approach was evaluated statically and dynamically by measuring the inclination of static wedge films and the thickness of the hydrodynamic lubricating film under running conditions, respectively. Results show that dichromatic interferometry can facilitate real-time determination of lubricating film thickness and is well suited for the study of transient or dynamic lubricating problems.

  18. Ultimate photovoltage in perovskite oxide heterostructures with critical film thickness

    SciTech Connect

    Wang Cong; Jin Kuijuan; Zhao Ruiqiang; Lu Huibin; Guo Haizhong; Ge Chen; He Meng; Wang Can; Yang Guozhen

    2011-05-02

    One order larger photovoltage is obtained with critical thicknesses of La{sub 0.9}Sr{sub 0.1}MnO{sub 3} films in both kinds of heterostructures of La{sub 0.9}Sr{sub 0.1}MnO{sub 3}/SrTiO{sub 3} (0.8 wt % Nb-doped) and La{sub 0.9}Sr{sub 0.1}MnO{sub 3}/Si fabricated at various oxygen pressures. Our self-consistent calculation reveals that the critical thickness of the La{sub 0.9}Sr{sub 0.1}MnO{sub 3} film with the ultimate value of photovoltage is just the thickness of the depletion layer of La{sub 0.9}Sr{sub 0.1}MnO{sub 3} in both heterojunctions, respectively.

  19. Optical monitoring of thin oil film thickness in extrusion processes

    NASA Astrophysics Data System (ADS)

    Bogdanowicz, Robert; Wroczyński, Piotr; Graczyk, Jan; Gnyba, Marcin

    2005-09-01

    We have used reflectance spectroscopy for the in-situ, non-invasive monitoring of a thin oil film thickness during extrusion process of ceramic paste in capillary rheometer. Investigated pastes are disperse solid liquid systems prepared from the silicone oil AK106 (Wacker) and ceramic powder AlOOH. The thin oil film, extracted from the extruded paste, appears on walls of the rheometer die. A borosilicate view-port-glass provides optical access to the thin film inside the die. Reflectance spectroscopy enables the thin film thickness measurements by wideband spectral analysis of light back reflected from the sample. This spectrum includes extremes, which results from interference between beams reflected from glass-oil boundary and oil-paste boundary. Position and intensity of this extremes were determined by thickness of the thin film as well as refractive indices of the oil and the paste. Optoelectronic system dedicated for process monitoring by means of reflectance spectroscopy had been designed and built. The system comprises tungsten halogen lamp and fiber optic spectrometer. Optical signals are transmitted through bifurcated fibers, focusing optics and the view-port-window. Spectroscopic monitoring was carried out in VIS-NIR range from 400 to 900 nm as a function of extrusion velocity (0.01-5mm/s) and paste particle granulation (5-20 μm). Computer calculation, performed using dedicated software, enables fast determination of thickness even for reflectance spectra interfered by high noise level. Fast development of ceramic components technology requires detailed description of complex rheometric processes. Monitoring of the most important process parameter - oil layer thickness - enables pre-determination of rheometric factors required for proper paste extrusion and accurate shape filling.

  20. Influence of substrate and film thickness on polymer LIPSS formation

    NASA Astrophysics Data System (ADS)

    Cui, Jing; Nogales, Aurora; Ezquerra, Tiberio A.; Rebollar, Esther

    2017-02-01

    Here we focus on the influence of both, substrate and film thickness on polymer Laser Induced Periodic Surface Structures (LIPSS) formation in polymer films. For this aim a morphological description of ripples structures generated on spin-coated polystyrene (PS) films by a linearly polarized laser beam with a wavelength of 266 nm is presented. The influence of different parameters on the quality and characteristics of the formed laser-induced periodic surface structures (LIPSS) was investigated. We found that well-ordered LIPSS are formed either on PS films thinner than 200 nm or thicker than 400 nm supported on silicon substrates as well as on thicker free standing films. However less-ordered ripples are formed on silicon supported films with intermediate thicknesses in the range of 200-380 nm. The effect of the thermal and optical properties of the substrate on the quality of LIPSS was analyzed. Differences observed in the fluence and number of pulses needed for the onset of surface morphological modifications is explained considering two main effects which are: (1) The temperature increase on polymer surface induced by the action of cumulative laser irradiation and (2) The differences in thermal conductivity between the polymer and the substrate which strongly affect the heat dissipation generated by irradiation.

  1. Influence of film thickness on the phase separation mechanism in ultrathin conducting polymer blend films.

    PubMed

    Meier, Robert; Ruderer, Matthias A; Diethert, Alexander; Kaune, Gunar; Körstgens, Volker; Roth, Stephan V; Müller-Buschbaum, Peter

    2011-03-31

    The film morphology of thin polymer blend films based on poly[(1-methoxy)-4-(2-ethylhexyloxy)-p-phenylenevinylene] (MEH-PPV) and poly(N-vinylcarbazole) (PVK) is probed as a function of film thickness. Blend films are prepared with spin-coating of polymer solutions with different concentrations on top of solid supports. The blending ratio of both conducting polymers is kept constant. The film and surface morphology is probed with grazing incidence ultrasmall-angle X-ray scattering (GIUSAXS) and atomic force microscopy (AFM). A linear dependence between the film thickness and the averaged phase separation is found. In addition, X-ray reflectivity measurements show an enrichment of PVK at the substrate interface. UV/vis spectroscopy measurements indicate a linearly increasing amount of both homopolymers in the blend films for increasing film thicknesses. The generalized knowledge about the influence of the film thickness on the phase separation behavior in conducting polymer blend films is finally used to describe the phase separation formation during the spin-coating process, and the results are discussed in the framework of an adapted Flory-Huggins theory for rodlike polymers.

  2. The production of Sr hexaferrite thick films by screen printing

    NASA Astrophysics Data System (ADS)

    Yuan, Z. C.; Williams, A. J.; Shields, T. C.; Blackburn, S.; Ponton, C. B.; Abell, J. S.; Harris, I. R.

    2002-06-01

    Hydrothermally synthesised Sr hexaferrite (HT-SrM) powder with a distinct plate-like shape and conventional Sr hexaferrite (c-SrM) powder were used to screen print SrM thick films on alumina substrates. In the case of the HT-SrM thick films, a very strong perpendicular magnetic anisotropy has been observed with remanence values of up to 42±2 J/T kg for the perpendicular direction and 15±1 J/T kg for the in-plane direction, and with coercivities of around 159±8 kA/m for both directions when fired at 1300°C. When fired at 1150°C, the remanences were 49±2 and 27±2 J/T kg for the two directions with a higher coercivity of 247±8 kA/m for both directions. The SEM micrographs showed that the platelet grains in the printed films lay with their flat surfaces on the substrate and XRD results revealed that the c-axis of the grains oriented perpendicularly to the film surface. The (0 0 8) plane, which is, for a random oriented sample, a very weak peak, appeared as the strongest in the XRD pattern for the films. EDX and XRD studies indicated significant reaction at the interfaces between the film and the substrate when the sintering temperature was raised to 1350°C. For the SrM thick films obtained from planetary milled ultrafine Sr hexaferrite and conventional Sr hexaferrite powder, a slight in-plane anisotropy could be observed with a coercivity of 318±8 kA/m.

  3. Film thickness measurements on five fluid formulations by the mercury squeeze film capacitance technique

    NASA Technical Reports Server (NTRS)

    Jones, W. R., Jr.; Johnson, R. L.; Hyslop, I.; Day, R.

    1976-01-01

    The thinning characteristics of five fluids were studied by measuring film thickness as a function of time. The mercury squeeze film capacitance technique was used. All tests were performed at room temperature. The synthetic hydrocarbon plus a nematic liquid crystal, N-(p-methoxybenzylidene)-p-butylaniline, thinned according to a Newtonian model and retained its bulk viscosity. The synthetic hydrocarbon plus a phosphonate antiwear additive and the synthetic hydrocarbon plus n-hexadecanol produced residual thick films. The synthetic hydrocarbon base fluids and the synthetic hydrocarbon plus a paraffinic resin displayed viscosity increases during thinning, but no residual films were formed.

  4. Thick-film humidity sensor based on porous ? material

    NASA Astrophysics Data System (ADS)

    Qu, Wenmin; Meyer, Jörg-Uwe

    1997-06-01

    A new compact, robust, yet fast and highly sensitive ceramic humidity sensor based on the semiconducting metal oxide 0957-0233/8/6/002/img2 has been developed using thick-film technology. The sensor element possesses a novel `sandwich' configuration with a 0957-0233/8/6/002/img3 porous 0957-0233/8/6/002/img2 ceramic layer sandwiched by two 0957-0233/8/6/002/img5 polarity-reversed interdigitated metal films. Instead of traditional glass frits, LiCl powders were used as adhesion promoters. The sintered ceramic layer exhibits a porous structure. The degree of the porosity is controlled by the amount of LiCl added and by the firing conditions for the ceramic. The surfaces of ceramic grains behave like electrolytes and easily adsorb water vapour through the pores. The novel electrode arrangement combines the advantages of humidity sensors in the form of a parallel capacitor with those in the form of an interdigital capacitor. The influence of temperature on the sensor characteristics has been compensated for by integrating a thick-film NTC resistor. The results of studies on the material processing, the fabrication and the characterization of this novel thick-film humidity sensor are described.

  5. Anisotropic resistivity in plasma-sprayed silicon thick films

    NASA Astrophysics Data System (ADS)

    Kharas, Boris Dave; Sampath, Sanjay; Gambino, Richard J.

    2005-05-01

    Silicon thick films deposited by thermal plasma spray are of interest as inexpensive electronic materials for conformal meso-scale electronics applications. In addition they also serve as a model system for the investigation of electrical properties of coatings with layered anisotropy. In this study impedance spectroscopy was used to measure the complex resistivity of free-standing 64μm-thick polycrystalline silicon films deposited by thermal plasma spraying in an atmospheric ambient. Impedance spectroscopy measurements were taken in the through-thickness (across-splat) and edge-to-edge (in-splat) directions and revealed a resistivity difference of approximately 7.5±0.23 between the two directions. The complex resistivity results are explained on the basis of a brick-layer type model, associated with the layered splat microstructure obtained from cross-sectional transmission electron microscope imaging of the films. In addition a circuit-based model made up of parallel, resistor-capacitor elements in series, and Cole-Cole and Davidson-Cole impedance functions were used to fit the impedance data to extract material parameters and contributions from the grains and splat boundaries. Furthermore, thermal processing and phosphorus doping is shown to lead to higher and lower resistivity, respectively, in the films.

  6. Thin soap films are quasi-2D fluids and thick soap films are not

    NASA Astrophysics Data System (ADS)

    Vivek, Skanda; Weeks, Eric R.

    2012-11-01

    We use microrheology to measure the 2D (interfacial) viscosity of soap films. Microrheology uses the diffusive motion of tracer particles suspended in the soap film to infer the viscosity. Our particles are colloids of diameter d = 0 . 5 μm. We measure the interfacial viscosity of soap films ranging in thickness from h = 0 . 5 μm to 2.0 μm. The thickness of these films is measured using the infrared absorbance of the water based soap films, based on a previous setup [X. L. Wu, R. Levine, M. A. Rutgers, H. Kellay, W.I. Goldburg, Rev. Sci. Inst. 72, 2467 (2001)]. From the knowledge of the film thickness and the viscosity of the fluid used to make the film, we can infer the interfacial viscosity due to the surfactant layers at the film/air interfaces. Consistent results are found for thin films (h / d < 3) whereas for thicker films inconsistent and unphysical results are found indicating 3D effects begin to play a role. The transition from 2D to 3D properties as a function of h / d is sharp.

  7. Discrete component bonding and thick film materials study

    NASA Technical Reports Server (NTRS)

    Kinser, D. L.

    1975-01-01

    The results are summarized of an investigation of discrete component bonding reliability and a fundamental study of new thick film resistor materials. The component bonding study examined several types of solder bonded components with some processing variable studies to determine their influence upon bonding reliability. The bonding reliability was assessed using the thermal cycle: 15 minutes at room temperature, 15 minutes at +125 C 15 minutes at room temperature, and 15 minutes at -55 C. The thick film resistor materials examined were of the transition metal oxide-phosphate glass family with several elemental metal additions of the same transition metal. These studies were conducted by preparing a paste of the subject composition, printing, drying, and firing using both air and reducing atmospheres. The resulting resistors were examined for adherence, resistance, thermal coefficient of resistance, and voltage coefficient of resistance.

  8. Ice-Accretion Scaling Using Water-Film Thickness Parameters

    NASA Technical Reports Server (NTRS)

    Anderson, David N.; Feo, Alejandro

    2003-01-01

    Studies were performed at INTA in Spain to determine water-film thickness on a stagnation-point probe inserted in a simulated cloud. The measurements were correlated with non-dimensional parameters describing the flow and the cloud conditions. Icing scaling tests in the NASA Glenn Icing Research Tunnel were then conducted using the Ruff scaling method with the scale velocity found by matching scale and reference values of either the INTA non-dimensional water-film thickness or a Weber number based on that film thickness. For comparison, tests were also performed using the constant drop-size Weber number and the average-velocity methods. The reference and scale models were both aluminum, 61-cm-span, NACA 0012 airfoil sections at 0 deg. AOA. The reference had a 53-cm-chord and the scale, 27 cm (1/2 size). Both models were mounted vertically in the center of the IRT test section. Tests covered a freezing fraction range of 0.28 to 1.0. Rime ice (n = 1.0) tests showed the consistency of the IRT calibration over a range of velocities. At a freezing fraction of 0.76, there was no significant difference in the scale ice shapes produced by the different methods. For freezing fractions of 0.40, 0.52 and 0.61, somewhat better agreement with the reference horn angles was typically achieved with the average-velocity and constant-film thickness methods than when either of the two Weber numbers was matched to the reference value. At a freezing fraction of 0.28, the four methods were judged equal in providing simulations of the reference shape.

  9. The Effects of Substrate Composition on Thick Film Circuit Reliability.

    DTIC Science & Technology

    1977-05-31

    NOTES *9. KEY WORDS (Conffitu. on r•r•r.• aid. ii n.c. ~~y ,d Id.n(Si~’ by block n.a,b.r)Thick Film Resistors Temperature Coefficient Resistivity Ceramic ...in a platinum crucible and held for 2 to 3 hours until a clear, single phase liquid was obtained . The glass was fritted in deionized water, ground

  10. Development of Thick-Film Thermoelectric Microcoolers Using Electrochemical Deposition

    NASA Technical Reports Server (NTRS)

    Fleurial, J.-P.; Borshchevsky, A.; Ryan, M. A.; Phillips, W. M.; Snyder, J. G.; Caillat, T.; Kolawa, E. A.; Herman, J. A.; Mueller, P.; Nicolet, M.

    2000-01-01

    Advanced thermoelectric microdevices integrated into thermal management packages and low power, electrical source systems are of interest for a variety of space and terrestrial applications. By shrinking the size of the thermoelements, or legs, of these devices, it becomes possible to handle much higher heat fluxes, as well as operate at much lower currents and higher voltages that are more compatible with electronic components. The miniaturization of state-of-the-art thermoelectric module technology based on Bi2Te3 alloys is limited due to mechanical and manufacturing constraints for both leg dimensions (100-200 gm thick minimum) and the number of legs (100-200 legs maximum). We are investigating the development of novel microdevices combining high thermal conductivity substrate materials such as diamond, thin film metallization and patterning technology, and electrochemical deposition of thick thermoelectric films. It is anticipated that thermoelectric microcoolers with thousands of thermocouples and capable of pumping more than 200 W/sq cm over a 30 to 60 K temperature difference can be fabricated. In this paper, we report on our progress in developing an electrochemical deposition process for obtaining 10-50 microns thick films of Bi2Te3 and its solid solutions. Results presented here indicate that good quality n-type Bi2Te3, n-type Bi2Te(2.95)Se(0.05) and p-type Bi(0.5)Sb(1.5)Te3 thick films can be deposited by this technique. Some details about the fabrication of the miniature thermoelements are also described.

  11. High-performance PMN-PT thick films.

    PubMed

    Kosec, Marija; Ursic, Hana; Holc, Janez; Hrovat, Marko; Kuscer, Danjela; Malic, Barbara

    2010-10-01

    This article describes some of our work on ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃ (0.65PMN-0.35PT) thick films printed on alumina substrates. These thick films, with the nominal composition ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃, were produced by screen-printing and firing a paste prepared from an organic vehicle and pre-reacted fine particles of avery chemically homogeneous powder. To improve the adhesion of the 0.65PMN-0.35PT to the platinized alumina substrate,a Pb(Zr₀.₅₃Ti₀.₄₇)O₃ layer was deposited between the electrode and the substrate. The samples were then sintered at 950 °C for 2 h with various amounts of packing powder on the alumina (Al₂O₃) substrates. The sintering procedure was optimized to obtain dense 0.65PMN-0.35PT films. The films were then characterized using scanning electron microscopy as well as measurements of the dielectric and piezoelectric constants.The electrostrictive behavior of the 0.65PMN-0.35PT thick films was investigated using an atomic force microscope(AFM). Finally, substrate-free, large-displacement bending type actuators were prepared and characterized, and the normalized displacement (i.e., the displacement per unit length) of the actuators was determined to be 55 μm/cm at 3.6 kV/cm.

  12. Tape casting and partial melting of Bi-2212 thick films

    NASA Technical Reports Server (NTRS)

    Buhl, D.; Lang, TH.; Heeb, B.; Gauckler, L. J.

    1995-01-01

    To produce Bi-2212 thick films with high critical current densities tape casting and partial melting is a promising fabrication method. Bi-2212 powder and organic additives were mixed into a slurry and tape casted onto glass by the doctor blade tape casting process. The films were cut from the green tape and partially molten on Ag foils during heat treatment. We obtained almost single-phase and well-textured films over the whole thickness of 20 microns. The orientation of the (a,b)-plane of the grains was parallel to the substrate with a misalignment of less than 6 deg. At 77 K/0T a critical current density of 15, 000 A/sq cm was reached in films of the dimension 1 cm x 2 cm x 20 microns (1 micron V/cm criterion, resistively measured). At 4 K/0T the highest value was 350,000 A/sq cm (1 nV/cm criterion, magnetically measured).

  13. Tape casting and partial melting of Bi-2212 thick films

    SciTech Connect

    Buhl, D.; Lang, T.; Heeb, B.

    1994-12-31

    To produce Bi-2212 thick films with high critical current densities tape casting and partial melting is a promising fabrication method. Bi-2212 powder and organic additives were mixed into a slurry and tape casted onto glass by the doctor blade tape casting process. The films were cut from the green tape and partially molten on Ag foils during heat treatment. We obtained almost single-phase and well-textured films over the whole thickness of 20 {mu}m. The orientation of the (a,b)-plane of the grains were parallel to the substrate with a misalignment of less than 6{degrees}. At 77K/OT a critical current density of 15`000 A/cm{sup 2} was reached in films of the dimension 1cm x 2cm x 20{mu}m (1{mu}V/cm criterion, resistively measured). At 4K/OT the highest value was 350`000 A/cm{sup 2} (1nV/cm criterion, magnetically measured).

  14. Effect of Substrates on Film Hardness Measurements of Nanometer Thick Amorphous Carbon Films

    NASA Astrophysics Data System (ADS)

    Akasaka, Hiroki; Ito, Hiroki; Nakano, Masayuki; Ohshio, Shigeo; Saitoh, Hidetoshi

    Amorphous carbon film (a-C:H) applications, such as hard disks, require films with nanometer thicknesses. In an indentation test, the obtained hardness values of these films are affected by substrates. On the indentation tests, we studied the effect of substrate hardness on films less than 200 nm in thickness. a-C:H and Si doped a-C:H (a-C:Si:H) films were deposited by electron cyclotron resonance plasma chemical vapor deposition onto aluminum (Al) and silicon (Si) substrates. The film thicknesses were approximately 140 nm. The hardnesses of the a-C:H film and substrates were obtained using a high-resolution indentation tester (pico-dentor) with a Vickers tip whose depth resolution was 0.04 nm. Maximum indentation loads were varied from 0.01 to 0.5 mN. The Martens hardnesses of films on the Al and Si substrates were 600 and 7000 N/mm2, respectively. On the a-C:Si:H film deposited on the Al substrate, the hardnesses increased from 1600 to 3900 N/mm2 with decreasing indentation load. The hardnesses of the films deposited on the Si substrate decreased from 5300 to 3500 N/mm2 when the maximum indentation loads were reduced. The effect of the substrates increased with the maximum load increasing. From these findings, the actual hardness value was determined to be 3600 N/mm2. These results indicate that the high-resolution indentation test achieved hardness estimations for nanometer-thick films with certain hardnesses.

  15. Screenable all-metal solar cell electrodes of nickel and copper

    NASA Technical Reports Server (NTRS)

    Ross, B.; Bickler, D. B.

    1981-01-01

    Screenable thick film solar cell electrodes are made using the all-metal electrode system, which eliminates the commonly used glass frit and substitutes an oxide scavenger such as silver fluoride. The low temperature firing copper metal systems give good results on solar cells obtaining cell efficiencies of 13% AM1, and adhering sintered structures are demonstrated with nickel systems. The potential effect of copper upon cell performance at elevated temperatures over long periods of time is determined, and it is found that the formation of a copper-silicon eutectic at 550 C produces needle-like structures with broad bases on the silicon, extending into and occasionally through the metallization layer.

  16. Barkhausen noise in variable thickness amorphous finemet films

    SciTech Connect

    Puppin, Ezio; Pinotti, Ermanno; Brenna, Massimiliano

    2007-03-15

    We measured the statistical properties of Barkhausen noise in finemet films with nominal composition Fe{sub 73.5}Cu{sub 1}Nb{sub 3}Si{sub 22.5}B{sub 4} and variable thickness between 25 and 1000 nm. Films have been sputtered on glass substrates and their structure is amorphous. The critical exponents of the power-law distributions for the jumps amplitude show a remarkable stability over the whole thickness range, whereas the other macroscopic magnetic properties undergo strong variations. The value of the critical exponent is about 0.8 between 50 and 500 nm with a small increase up to 1.0 at 1000 nm. These values are similar to those observed with the same experimental technique in other two-dimensional (2D) systems, but definitely smaller with respect to the values observed in truly three-dimensional (3D) systems. Our data therefore indicate that, in the investigated thickness range, the behavior remains typical of 2D systems. The small increase of the critical exponent at 1000 nm might be an indication of a starting transition toward a 3D behavior.

  17. Film thickness for different regimes of fluid-film lubrication. [elliptical contacts

    NASA Technical Reports Server (NTRS)

    Hamrock, B. J.; Dowson, D.

    1983-01-01

    Mathematical formulas are presented which express the dimensionless minimum film thickness for the four lubrication regimes found in elliptical contacts: isoviscous-rigid regime; piezoviscous-rigid regime; isoviscous-elastic regime; and piezoviscous-elastic regime. The relative importance of pressure on elastic distortion and lubricant viscosity is the factor that distinguishes these regimes for a given conjunction geometry. In addition, these equations were used to develop maps of the lubrication regimes by plotting film thickness contours on a log-log grid of the dimensionless viscosity and elasticity parameters for three values of the ellipticity parameter. These results present a complete theoretical film thickness parameter solution for elliptical constants in the four lubrication regimes. The results are particularly useful in initial investigations of many practical lubrication problems involving elliptical conjunctions.

  18. Method for making thick and/or thin film

    DOEpatents

    Pham, Ai Quoc; Glass, Robert S.

    2004-11-02

    A method to make thick or thin films a very low cost. The method is generally similar to the conventional tape casting techniques while being more flexible and versatile. The invention involves preparing a slip (solution) of desired material and including solvents such as ethanol and an appropriate dispersant to prevent agglomeration. The slip is then sprayed on a substrate to be coated using an atomizer which spreads the slip in a fine mist. Upon hitting the substrate, the solvent evaporates, leaving a green tape containing the powder and other additives, whereafter the tape may be punctured, cut, and heated for the desired application. The tape thickness can vary from about 1 .mu.m upward.

  19. Thick film magnetic nanoparticulate composites and method of manufacture thereof

    NASA Technical Reports Server (NTRS)

    Ma, Xinqing (Inventor); Zhang, Yide (Inventor); Ge, Shihui (Inventor); Zhang, Zongtao (Inventor); Yan, Dajing (Inventor); Xiao, Danny T. (Inventor)

    2009-01-01

    Thick film magnetic/insulating nanocomposite materials, with significantly reduced core loss, and their manufacture are described. The insulator coated magnetic nanocomposite comprises one or more magnetic components, and an insulating component. The magnetic component comprises nanometer scale particles (about 1 to about 100 nanometers) coated by a thin-layered insulating phase. While the intergrain interaction between the immediate neighboring magnetic nanoparticles separated by the insulating phase provides the desired soft magnetic properties, the insulating material provides high resistivity, which reduces eddy current loss.

  20. Selected electrical properties of high ohmic thick-film resistors

    NASA Astrophysics Data System (ADS)

    DÄ browski, Arkadiusz; Tatar, Adam; Dziedzic, Andrzej

    2016-12-01

    Results of fabrication as well as electrical and stability characterization of thick-film high ohmic resistors are described in this paper. Five commercially available resistive compositions with sheet resistance of 1, 10, and 100 MΩ/sq were applied. The best properties were obtained for the lowest sheet resistance pastes, for which voltage coefficient of resistance (VCR) was lower than 3 ppm/V and hot temperature coefficient of resistance (HTCR) below 50 ppm/°C. Effect of resistor length on sheet resistance and impact of termination material were analyzed. High voltage pulse stress at 2 kV had negligible influence on resistors' properties.

  1. Reduced temperature-dependent thermal conductivity of magnetite thin films by controlling film thickness

    NASA Astrophysics Data System (ADS)

    Park, No-Won; Lee, Won-Yong; Kim, Jin-A.; Song, Kyungjun; Lim, Hyuneui; Kim, Wan-Doo; Yoon, Soon-Gil; Lee, Sang-Kwon

    2014-02-01

    We report on the out-of-plane thermal conductivities of epitaxial Fe3O4 thin films with thicknesses of 100, 300, and 400 nm, prepared using pulsed laser deposition (PLD) on SiO2/Si substrates. The four-point probe three-omega (3- ω) method was used for thermal conductivity measurements of the Fe3O4 thin films in the temperature range of 20 to 300 K. By measuring the temperature-dependent thermal characteristics of the Fe3O4 thin films, we realized that their thermal conductivities significantly decreased with decreasing grain size and thickness of the films. The out-of-plane thermal conductivities of the Fe3O4 films were found to be in the range of 0.52 to 3.51 W/m · K at 300 K. For 100-nm film, we found that the thermal conductivity was as low as approximately 0.52 W/m · K, which was 1.7 to 11.5 order of magnitude lower than the thermal conductivity of bulk material at 300 K. Furthermore, we calculated the temperature dependence of the thermal conductivity of these Fe3O4 films using a simple theoretical Callaway model for comparison with the experimental data. We found that the Callaway model predictions agree reasonably with the experimental data. We then noticed that the thin film-based oxide materials could be efficient thermoelectric materials to achieve high performance in thermoelectric devices.

  2. Effects of accumulated film layers on the accuracy of quartz film thickness monitors

    NASA Technical Reports Server (NTRS)

    Heyman, J. S.; Miller, W. E.

    1978-01-01

    The effect of accumulation layers on the accuracy of quartz thin-film thickness monitors is evaluated. Use of an expanded plane wave ultrasonic propagation theory correctly accounts for observed experimental data. The magnitude of the maximum errors calculated for simply reversing the order of a series of aluminum gold deposits is on the order of 5%. If one totally neglects intervening layers, multiple film propagation and nonlinearity can produce errors greater than 50%.

  3. Thick Films acoustic sensors devoted to MTR environment measurements. Thick Films acoustic sensors devoted to Material Testing Reactor environment measurements

    SciTech Connect

    Very, F.; Rosenkrantz, E.; Combette, P.; Ferrandis, J.Y.; Fourmentel, D.; Destouches, C.; Villard, J.F.

    2015-07-01

    The development of advanced instrumentation for in-pile experiments in Material Testing Reactor constitutes a main goal for the improvement of the nuclear fuel behavior knowledge. An acoustic method for fission gas release detection was tested with success during a first experiment called REMORA 3 in 2010 and 2011, and the results were used to differentiate helium and fission gas release kinetics under transient operating conditions. This experiment was lead at OSIRIS reactor (CEA Saclay, France). The maximal temperature on the sensor during the irradiation was about 150 deg. C. In this paper we present a thick film transducer produce by screen printing process. The screen printing of piezoelectric offers a wide range of possible applications for the development of acoustic sensors and piezoelectric structure for measurements in high temperature environment. We firstly produced a Lead Zirconate Titanate (PZT) based paste composed of Pz27 powder from Ferroperm, CF7575 glass, and organic solvent ESL 400. Likewise a Bismuth Titanate based paste synthesized in our laboratory was produced. With these inks we produced thick film up to 130 μm by screen printing process. Material properties characterizations of these thick-film resonators are essential for device design and applications. The piezoelectric coefficients d33 and pyro-electric P(T) coefficient are investigated. The highest P(T) and d33 are respectively 80 μC.m{sup -2}.K{sup -1} and 130 μC.N{sup -1} for the PZT transducer -which validates the fabrication process-. In view of the development of this transducer oriented for high temperature and irradiation environment, we investigated the electrical properties of the transducers for different ranges of frequencies and temperature - from 20 Hz up to 40 MHz between 30 and 400 deg. C. We highlight the evolution of the impedance response and piezoelectric parameters of screen printed piezoelectric structures on alumina. Shortly an irradiation will be realized in

  4. Research on the measurement of thin film thickness based on phaseshift interferometry

    NASA Astrophysics Data System (ADS)

    Shi, Yi-lei; Su, Jun-hong; Yang, Li-hong; Xu, Jun-qi

    2009-05-01

    Only by solving the problem of accurate measurement of thin film thickness, will it be possible to solve the problem of thin film preparation. A novel measurement method of thin film thickness based on phase-shift interferometry is presented in the paper. Taking advantage of Twyman-Green interferometer, the multi-frame interferogram measured the thin film can be obtained by receiving the interference fringes of thin film by means of CCD and using digital acquisition card to collect interferogram and with the help of computer control PZT driver and modulation piezoelectric regulator to promote reference mirror uniformly-spaced movement. After the gained interferogram were disposed of phase unwrapped, 3D wavefront containing the information of thin film thickness can be obtained. According to the characteristics between the thin film thickness and the unwrapping phase, taking advantage of the overlapping 4-frame average algorithm, corresponding relationships between the quantification phase information and thin film thickness of each point has been established to realize the thin film thickness accurate measurement. The results show that this method has the advantage of non-contact, the high accuracy, not only has testified the feasibility of film thickness measurement with phase-shift interferometry, but also has further ensured research and optimization of the thin film preparation technics. The PV and RMS value of the measured thin film thickness are 0.162μm and 0.043μm respectively.

  5. Influence of colorant and film thickness on thermal aging characteristics of oxo-biodegradable plastic bags

    NASA Astrophysics Data System (ADS)

    Leuterio, Giselle Lou D.; Pajarito, Bryan B.; Domingo, Carla Marie C.; Lim, Anna Patricia G.

    2016-05-01

    Functional, lightweight, strong and cheap plastic bags incorporated with pro-oxidants undergo accelerated degradation under exposure to heat and oxygen. This work investigated the effect of colorant and film thickness on thermal aging characteristics of commercial oxo-biodegradable plastic bag films at 70 °C. Degradation is monitored through changes in infrared absorption, weight, and tensile properties of thermally aged films. The presence of carbonyl band in infrared spectrum after 672 h of thermal aging supports the degradation behavior of exposed films. Results show that incorporation of colorant and increasing thickness exhibit low maximum weight uptake. Titanium dioxide as white colorant in films lowers the susceptibility of films to oxygen uptake but enhances physical degradation. Higher amount of pro-oxidant loading also contributes to faster degradation. Opaque films are characterized by low tensile strength and high elastic modulus. Decreasing the thickness contributes to lower tensile strength of films. Thermally aged films with colorant and low thickness promote enhanced degradation.

  6. Relation between molecule ionization energy, film thickness and morphology of two indandione derivatives thin films

    NASA Astrophysics Data System (ADS)

    Grzibovskis, Raitis; Vembris, Aivars; Pudzs, Kaspars

    2016-08-01

    Nowadays most organic devices consist of thin (below 100 nm) layers. Information about the morphology and energy levels of thin films at such thickness is essential for the high efficiency devices. In this work we have investigated thin films of 2-(4-[N,N-dimethylamino]-benzylidene)-indene-1,3-dione (DMABI) and 2-(4-(bis(2-(trityloxy)ethyl)amino)benzylidene)-2H-indene-1,3-dione (DMABI-6Ph). DMABI-6Ph is the same DMABI molecule with attached bulky groups which assist formation of amorphous films from solutions. Polycrystalline structure was obtained for the DMABI thin films prepared by thermal evaporation in vacuum and amorphous structure for the DMABI-6Ph films prepared by spin-coating method. Images taken by SEM showed separate crystals or islands at the thickness of the samples below 100 nm. The ionization energy of the studied compounds was determined using photoemission yield spectroscopy. A vacuum level shift of 0.40 eV was observed when ITO electrode was covered with the thin film of the organic compound. Despite of the same active part of the investigated molecules the ITO/DMABI interface is blocking electrons while ITO/DMABI-6Ph interface is blocking holes.

  7. Development of metal oxide impregnated stilbite thick film ethanol sensor

    NASA Astrophysics Data System (ADS)

    Mahabole, M. P.; Lakhane, M. A.; Choudhari, A. L.; Khairnar, R. S.

    2016-05-01

    This paper presents the study of the sensing efficiency of Titanium oxide/ Stilbite and Copper oxide /Stilbite composites towards detection of hazardous pollutants like ethanol. Stilbite based composites are prepared by physically mixing zeolite with metal oxides namely TiO2 and CuO with weight ratios of 25:75, 50:50 and 75:25. The resulting sensor materials are characterized by X-ray diffraction and Fourier Transform Infrared Spectroscopy techniques. Composite sensors are fabricated in the form of thick film by using screen printing technique. The effect of metal oxide concentration on various ethanol sensing parameters such as operating temperature, maximum uptake capacity and response/recovery time are investigated. The results indicate that metal oxide impregnated stilbite composites have great potential as low temperature ethanol sensor.

  8. Magnetic Probe Construction using Thick-film Technology

    SciTech Connect

    Takahashi, H.; Sakakibara, S.; Kubota, Y.; and Yamada, H.

    2001-02-02

    Thick-film technology has been successfully adapted for the design and fabrication of magnetic probes of a new type suitable for use in the simultaneous ultra-high vacuum and high-temperature environment of a nuclear fusion device. The maximum usable temperature is expected to be around 900 degrees C. This new probe has a specific sensitivity (coupling area per unit volume) an order of magnitude higher than a conventional coil. The new probe in one implementation is capable of simultaneously measuring magnetic field in three orthogonal directions about a single spatial point and in two frequency ranges. Low-frequency coils have a measured coupling area of 296-323 cm squared and a frequency response of about 300 kHz. High-frequency coils have a design coupling area of 12-15 cm squared.

  9. LTCC Phase Shifters Based on Tunable Ferroelectric Composite Thick Films

    NASA Astrophysics Data System (ADS)

    Nikfalazar, M.; Kohler, C.; Heunisch, A.; Wiens, A.; Zheng, Y.; Schulz, B.; Mikolajek, M.; Sohrabi, M.; Rabe, T.; Binder, J. R.; Jakoby, R.

    2015-11-01

    This paper presents, the investigation of tunable components based on LTCC technology, implementing ferroelectric tunable thick-film dielectric. The tunable loaded line phase shifters are fabricated with metal-insulator-metal (MIM) varactors to demonstrate the capabilities of this method for packaging of the tunable components. The MIM varactors consist of one tunable dielectric paste layer that is printed between two silver layers. The tunable ferroelectric paste is optimized for LTCC sintering temperature around 850°C. The phase shifters are fabricated in two different process. They were achieved a figure of merit of 24°/dB (phase shift 192°) at 3 GHz and 18°/dB (phase shift 98°) at 4.4 GHz by using seven unit cells that each unit cell consisting of two MIM varactors.

  10. A 10-GHz film-thickness-mode cavity optomechanical resonator

    NASA Astrophysics Data System (ADS)

    Han, Xu; Fong, King Y.; Tang, Hong X.

    2015-04-01

    We report on the advance of chip-scale cavity optomechanical resonators to beyond 10 GHz by exploiting the fundamental acoustic thickness mode of an aluminum nitride micro-disk. By engineering the mechanical anchor to minimize the acoustic loss, a quality factor of 1830 and hence a frequency-quality factor product of 1.9 × 1013 Hz are achieved in ambient air at room temperature. Actuated by strong piezo-electric force, the micro-disk resonator shows an excellent electro-optomechanical transduction efficiency. Our detailed analysis of the electro-optomechanical coupling allows identification and full quantification of various acoustic modes spanning from super-high to X-band microwave frequencies measured in the thin film resonator.

  11. Reduced temperature-dependent thermal conductivity of magnetite thin films by controlling film thickness.

    PubMed

    Park, No-Won; Lee, Won-Yong; Kim, Jin-A; Song, Kyungjun; Lim, Hyuneui; Kim, Wan-Doo; Yoon, Soon-Gil; Lee, Sang-Kwon

    2014-02-26

    We report on the out-of-plane thermal conductivities of epitaxial Fe3O4 thin films with thicknesses of 100, 300, and 400 nm, prepared using pulsed laser deposition (PLD) on SiO2/Si substrates. The four-point probe three-omega (3-ω) method was used for thermal conductivity measurements of the Fe3O4 thin films in the temperature range of 20 to 300 K. By measuring the temperature-dependent thermal characteristics of the Fe3O4 thin films, we realized that their thermal conductivities significantly decreased with decreasing grain size and thickness of the films. The out-of-plane thermal conductivities of the Fe3O4 films were found to be in the range of 0.52 to 3.51 W/m · K at 300 K. For 100-nm film, we found that the thermal conductivity was as low as approximately 0.52 W/m · K, which was 1.7 to 11.5 order of magnitude lower than the thermal conductivity of bulk material at 300 K. Furthermore, we calculated the temperature dependence of the thermal conductivity of these Fe3O4 films using a simple theoretical Callaway model for comparison with the experimental data. We found that the Callaway model predictions agree reasonably with the experimental data. We then noticed that the thin film-based oxide materials could be efficient thermoelectric materials to achieve high performance in thermoelectric devices.

  12. Novel Ballistic Processing of Sn-0.7Cu Thick Films

    NASA Astrophysics Data System (ADS)

    Cavero, D.; Stewart, K.; Morsi, K.

    2017-01-01

    The present paper discusses a novel process (Ballistic Processing) for the ultra-rapid processing of textured and un-textured thick and potentially thin films. The effect of processing velocity (14.6 to 36.1 m/s) on the developed external structure and internal microstructure of Sn-0.7Cu thick film is discussed. Film thicknesses ranging from 6.08 to 12.79 μm were produced and characterized by two-dimensional hypoeutectic microstructures. Both film thickness and dendrite arm spacing decreased with an increase in processing velocity.

  13. Thick-film acoustic emission sensors for use in structurally integrated condition-monitoring applications.

    PubMed

    Pickwell, Andrew J; Dorey, Robert A; Mba, David

    2011-09-01

    Monitoring the condition of complex engineering structures is an important aspect of modern engineering, eliminating unnecessary work and enabling planned maintenance, preventing failure. Acoustic emissions (AE) testing is one method of implementing continuous nondestructive structural health monitoring. A novel thick-film (17.6 μm) AE sensor is presented. Lead zirconate titanate thick films were fabricated using a powder/sol composite ink deposition technique and mechanically patterned to form a discrete thick-film piezoelectric AE sensor. The thick-film sensor was benchmarked against a commercial AE device and was found to exhibit comparable responses to simulated acoustic emissions.

  14. Structure and magnetic properties of Co-P films of nanometer thickness

    NASA Astrophysics Data System (ADS)

    Chzhan, A. V.; Patrin, G. S.; Kiparisov, S. Ya.; Seredkin, V. A.; Pal'Chik, M. G.

    2010-06-01

    The main features of the formation of chemically deposited thin polycrystalline Co-P films of nanometer thickness have been determined experimentally. Changes in the surface structure of films with different thicknesses have been determined using an atomic force microscope. It has been established that at thicknesses smaller than 10 nm the films represent a set of weakly connected nuclei of crystallites with random orientations of easy axes. The subsequent increase in the thickness of films leads to the formation of a uniform polycrystalline layer. Estimates are given, which make it possible to determine the magnetic state of crystallites for the case of their weak magnetic interaction.

  15. Elastohydrodynamic film thickness formula based on X-ray measurements with a synthetic paraffinic oil

    NASA Technical Reports Server (NTRS)

    Loewenthal, S. H.; Parker, R. J.; Zaretsky, E. V.

    1973-01-01

    An empirical elastohydrodynamic film thickness formula for heavily loaded contacts based upon X-ray film thickness measurements made with a synthetic paraffinic oil is presented. The deduced relation was found to adequately reflect the high load dependence exhibited by the measured minimum film thickness data at high Hertizian contact stresses, that is, above 1.04 x 10 to the ninth N/sq m (150,000 psi). Comparisons were made with the numerical results from a theoretical isothermal film thickness formula. The effects of changes in contact geometry, material, and lubricant properties on the form of the empirical model are also discussed.

  16. Charge transport in films of Geobacter sulfurreducens on graphite electrodes as a function of film thickness.

    PubMed

    Jana, Partha Sarathi; Katuri, Krishna; Kavanagh, Paul; Kumar, Amit; Leech, Dónal

    2014-05-21

    Harnessing, and understanding the mechanisms of growth and activity of, biofilms of electroactive bacteria (EAB) on solid electrodes is of increasing interest, for application to microbial fuel and electrolysis cells. Microbial electrochemical cell technology can be used to generate electricity, or higher value chemicals, from organic waste. The capability of biofilms of electroactive bacteria to transfer electrons to solid anodes is a key feature of this emerging technology, yet the electron transfer mechanism is not fully characterized as yet. Acetate oxidation current generated from biofilms of an EAB, Geobacter sulfurreducens, on graphite electrodes as a function of time does not correlate with film thickness. Values of film thickness, and the number and local concentration of electrically connected redox sites within Geobacter sulfurreducens biofilms as well as a charge transport diffusion co-efficient for the biofilm can be estimated from non-turnover voltammetry. The thicker biofilms, of 50 ± 9 μm, display higher charge transport diffusion co-efficient than that in thinner films, as increased film porosity of these films improves ion transport, required to maintain electro-neutrality upon electrolysis.

  17. Physical and electronic properties of electrodeposited ZnO thin films: dependence on thickness

    NASA Astrophysics Data System (ADS)

    Kıcır, N.; Ozkendir, O. M.; Farha, A. H.; Kırmızıgül, F.; Tuken, T.; Gumus, C.; Çabuk, S.; Erbil, M.; Ufuktepe, Y.

    2015-10-01

    ZnO films have been prepared on indium tin oxide-coated glass substrates, with the help of a potentiostatic method in aqueous zinc nitrate solution. Dependence of crystallographic, optical and electronic properties on thickness of the film is reported and discussed. An increase in the film thickness causes an increase in the band and leads to an improvement in crystallinity and conductivity. The experimental results suggest a strong correlation between electronic and crystal structure of the polycrystalline wurtzite ZnO films. These observations can be used to establish guidelines for optimizing the thickness and orientation to increase the control of device performance based on ZnO thin films.

  18. Method and system for producing sputtered thin films with sub-angstrom thickness uniformity or custom thickness gradients

    DOEpatents

    Folta, James A.; Montcalm, Claude; Walton, Christopher

    2003-01-01

    A method and system for producing a thin film with highly uniform (or highly accurate custom graded) thickness on a flat or graded substrate (such as concave or convex optics), by sweeping the substrate across a vapor deposition source with controlled (and generally, time-varying) velocity. In preferred embodiments, the method includes the steps of measuring the source flux distribution (using a test piece that is held stationary while exposed to the source), calculating a set of predicted film thickness profiles, each film thickness profile assuming the measured flux distribution and a different one of a set of sweep velocity modulation recipes, and determining from the predicted film thickness profiles a sweep velocity modulation recipe which is adequate to achieve a predetermined thickness profile. Aspects of the invention include a practical method of accurately measuring source flux distribution, and a computer-implemented method employing a graphical user interface to facilitate convenient selection of an optimal or nearly optimal sweep velocity modulation recipe to achieve a desired thickness profile on a substrate. Preferably, the computer implements an algorithm in which many sweep velocity function parameters (for example, the speed at which each substrate spins about its center as it sweeps across the source) can be varied or set to zero.

  19. Thickness dependent CARS measurement of polymeric thin films without depth-profiling.

    PubMed

    Choi, Dae Sik; Jeoung, Sae Chae; Chon, Byung-Hyuk

    2008-02-18

    Coherent anti-Stokes Raman scattering (CARS) microscopy is demonstrated to be a promising optical method for the characterization of polymer films with film thickness varying between 180 nm to 4300 nm. In case of PMMA films with a thickness of few hundreds of nanometers, the observed CARS signal was mainly associated with the interference effect of large nonresonant CARS field from glass substrate and the weak resonant field of PMMA. The dependence of resonant CARS intensity of PMMA film on film thickness is in good agreement with the theoretical prediction on a CARS field. The current work offers potential possibilities of noninvasive thickness measurement of polymeric thin film of thickness less than 180 nm by multiplex CARS microscopy without depth-profiling.

  20. Development of Economical Improved Thick Film Solar Cell Contact

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1979-01-01

    Materials were surveyed to provide candidates for an all metal electrode paste system. These consisted of a major constituent metal powder, a low melting metal powder suitable for a liquid phase sintering medium, and a powder material suitable as an etchant for silicon dioxide at sintering temperatures. By means of thermal gravimetric analysis a suitable binder was identified for low temperature fired inks.

  1. On-Line Measurement of Lubricant Film Thickness Using Ultrasonic Reflection Coefficients

    SciTech Connect

    Drinkwater, B.W.; Dwyer-Joyce, R.S.; Harper, P.

    2004-02-26

    The ultrasonic reflectivity of a lubricant layer between two solid bodies depends on the ultrasonic frequency, the acoustic properties of the liquid and solid, and the layer thickness. In this paper, ultrasonic reflectivity measurements are used as a method for determining the thickness of lubricating films in bearing systems. An ultrasonic transducer is positioned on the outside of a bearing shell such that the wave is focused on the lubricant film layer. For a particular lubricant film the reflected pulse is processed to give a reflection coefficient spectrum. The lubricant film thickness is then obtained from either the layer stiffness or the resonant frequency. The method has been validated using static fluid wedges and the elastohydrodynamic film formed between a ball sliding on a flat. Film thickness values in the range 50-500 nm were recorded which agreed well with theoretical film formation predictions.

  2. Radial Dependence of Spin-Cast Polymer/Clay Nanocomposite Film Thickness

    NASA Astrophysics Data System (ADS)

    Li, Jun; Singh, Avtar; Schiffman, Scott; Kapoor, Deepak; Schwarz, Steven; Sokolov, Jonathan; Rafailovich, Miriam

    2004-03-01

    The thickness of spin-cast PS (polystyrene), PMMA (polymethylmethacrylate), and PB (polybutadiene) films on silicon wafers are examined as a function of solvent concentration, concentration of clay (Cloisite 6A) filler, and spin rate. A strong radial dependence of film thickness is observed in the clay composite films. As film thickness is a competition between evaporation rate and viscous flow, these properties are independently measured. Evaporation is determined by weight loss measurements, while viscosity vs. shear rate is measured in an ARES rheometer. Film thickness for composite films is determined by measuring scratch depths with a Dektak surface profilometer. Clay orientation within the film is examined by transmission electron microscopy. The viscosity and evaporation rate data are fed into a simple computer algorithm, which provides a semi-quantitative description of the data obtained. The radial dependence predicted by this simple physical model is too weak, however, most probably owing to the effects of clay platelet alignment during the spinning process.

  3. Influence of the thickness on the morphology and sensing ability of thermally-deposited tellurium films

    NASA Astrophysics Data System (ADS)

    Hristova-Vasileva, T.; Bineva, I.; Dinescu, A.; Nesheva, D.; Arsova, D.; Pejova, B.

    2016-03-01

    Tellurium films with nominal thicknesses of 30, 90 and 300 nm were prepared by thermal evaporation in vacuum at a low deposition rate of 0.3 nm/s. The morphology evolution with the increase of the film thickness was observed by scanning electron microscopy and atomic force microscopy. Nanorods with a width of about 40 nm were observed on the thinnest films surface. On the 90 nm thick films, the formations grew in priority in the z-direction to nanoblades with the same width, but a length of about 100 nm. The further increase of the thickness led to an increase of the 2D nanoobjects' width and length and formation of a stacked nanosheet structure. The surface root-mean-square roughness (Sq) increased with the thickness of the films. Preliminary investigations of the sensing ability of the as-deposited tellurium films with different thicknesses towards water (H2O), ethanol (C2H5OH), acetone (C3H5OH), and ammonia (NH3) vapors were performed by measuring the vapor-induced changes in the film dark current. The films showed appreciable response only to ammonia vapors; their sensitivity was almost equal for the 30 and 90 nm thick films, and decreased significantly for the film tkness of 300 nm.

  4. Influence of Thickness on Ethanol Sensing Characteristics of Doctor-bladed Thick Film from Flame-made ZnO Nanoparticles

    PubMed Central

    Liewhiran, Chaikarn; Phanichphant, Sukon

    2007-01-01

    ZnO nanoparticles were produced by flame spray pyrolysis (FSP) using zinc naphthenate as a precursor dissolved in toluene/acetonitrile (80/20 vol%). The particle properties were analyzed by XRD, BET, and HR-TEM. The sensing films were produced by mixing the particles into an organic paste composed of terpineol and ethyl cellulose as a vehicle binder and were fabricated by doctor-blade technique with various thicknesses (5, 10, 15 μm). The morphology of the sensing films was analyzed by SEM and EDS analyses. The gas sensing characteristics to ethanol (25-250 ppm) were evaluated as a function of film thickness at 400°C in dry air. The relationship between thickness and ethanol sensing characteristics of ZnO thick film on Al2O3 substrate interdigitated with Au electrodes were investigated. The effects of film thickness, as well as the cracking phenomenon, though, many cracks were observed for thicker sensing films. Crack widths increased with increasing film thickness. The film thickness, cracking and ethanol concentration have significant effect on the sensing characteristics. The sensing characteristics with various thicknesses were compared, showing the tendency of the sensitivity to ethanol decreased with increasing film thickness and response time. The relationship between gas sensing properties and film thickness was discussed on the basis of diffusively and reactivity of the gases inside the oxide films. The thinnest sensing film (5 μm) showed the highest sensitivity and the fastest response time (within seconds).

  5. Laser desorption of NO from a thick C 60 film

    NASA Astrophysics Data System (ADS)

    Hoger, T.; Marzok, C.; Jongma, R. T.; Zacharias, H.

    2006-09-01

    The desorption of NO molecules from a thick C 60 film is reported. A thermal desorption spectrum indicates two adsorption sites with binding energies of Eb = 0.30 eV and 0.55 eV. For laser desorption the fullerene surface is exposed to NO and excited by 7 ns UV laser pulses. Desorbing NO molecules are recorded state selectively as well as time resolved. The time-of-flight measurement indicates three different desorption pathways. A fast channel shows rovibronic temperatures of Trot( v″ = 0) = 370 K, Trot( v″ = 1) = 390 K and Tvib = 610 K as well as strong rotational-translational coupling. The desorption yield for the fast channel increases linearly with pulse energy with a desorption cross section of σ = (5.1 ± 0.9) × 10 -17 cm 2. Dominating the signal for small J″ values is a slow channel with low rotational and translational temperatures of about 110 K. We assign this peak to a laser-induced thermal desorption. For large pump-probe delays the data deviate from the Maxwellian flux distribution and a third channel appears with extremely late arrival times.

  6. Effect of thickness on electrical properties of SILAR deposited SnS thin films

    NASA Astrophysics Data System (ADS)

    Akaltun, Yunus; Astam, Aykut; Cerhan, Asena; ćayir, Tuba

    2016-03-01

    Tin sulfide (SnS) thin films of different thickness were prepared on glass substrates by successive ionic layer adsorption and reaction (SILAR) method at room temperature using tin (II) chloride and sodium sulfide aqueous solutions. The thicknesses of the films were determined using spectroscopic ellipsometry measurements and found to be 47.2, 65.8, 111.0, and 128.7nm for 20, 25, 30 and 35 deposition cycles respectively. The electrical properties of the films were investigated using d.c. two-point probe method at room temperature and the results showed that the resistivity was found to decrease with increasing film thickness.

  7. Application of the Ultrasonic Oil Film Thickness Measurement System in Bearing Chambers

    NASA Astrophysics Data System (ADS)

    Zhong, Chong; Hu, Jian-ping; Liu, Zhen-xia; Lu, Ya-guo; Hao, Yu-ya

    2014-06-01

    The oil film thickness in aero-engine bearing chamber influences the heat transfer capacity of the bearing chamber wall, so measuring oil film thickness accuspeedly is essential to the design and thermal analysis of lubricating oil system. In this paper, software and hardware of an ultrasonic measurement system based on pulse echo technique, which measures the oil film thickness in bearing chamber, are established. The hardware system mainly consists of signal acquisition card, probe, delay block and the corresponding cables. Functions as measurement parameter setup, real-time display of measured waveforms, post-processing and so on are included in the measurement software. Finally, the oil film thickness of the wall is measured with the measurement system developed. Signal quality of the dynamic measurement is analyzed. Comparison and analysis of different oil film thickness under different rotation rates are conducted.

  8. Thick-film MEMS thermoelectric sensor fabricated using a thermally assisted lift-off process

    NASA Astrophysics Data System (ADS)

    Jia, Yuan; Cai, Haogang; Lin, Qiao

    2016-04-01

    This paper presents a thick-film microelectromechanical systems thermoelectric sensor fabricated by a low-temperature thermally assisted lift-off process. During the process, thick metal or semiconductor films experience controlled breakup due to thermal reflow of the underlying lithographically defined photoresist patterns, thereby facilitating the sacrificial removal of the photoresist. This enables rapid and reliable patterning of thick films that can otherwise be difficult to achieve by conventional processes. Experimental results with a sensor consisting of a 60-junction thick-film antimony-bismuth thermopile demonstrate an electric conductivity of 5.44×106 S/m and a Seebeck coefficient of 114 μV/K per junction, which are comparable to those obtained from bulk materials. Thus, the thick-film sensor can potentially allow low-noise, high-efficiency thermoelectric measurements.

  9. Thickness- and temperature-dependent magnetodynamic properties of yttrium iron garnet thin films

    SciTech Connect

    Haidar, M. Ranjbar, M.; Balinsky, M.; Dumas, R. K.; Khartsev, S.; Åkerman, J.

    2015-05-07

    The magnetodynamical properties of nanometer-thick yttrium iron garnet films are studied using ferromagnetic resonance as a function of temperature. The films were grown on gadolinium gallium garnet substrates by pulsed laser deposition. First, we found that the damping coefficient increases as the temperature increases for different film thicknesses. Second, we found two different dependencies of the damping on film thickness: at room temperature, the damping coefficient increases as the film thickness decreases, while at T = 8 K, we find the damping to depend only weakly on the thickness. We attribute this behavior to an enhancement of the relaxation of the magnetization by impurities or defects at the surfaces.

  10. Development of economical improved thick film solar cell contact

    NASA Technical Reports Server (NTRS)

    Ross, B.; Mentley, D.

    1979-01-01

    Materials were surveyed to provide candidates for an all metal electrode paste system. These consisted of a major constituent metal powder, a low melting metal powder suitable for a liquid phase sintering medium, and a powder material suitable as an etchant for silicon dioxide at sintering temperatures. By means of thermal gravimetric analysis a suitable binder was identified for low temperature fired inks. The all metal ink concept was first demonstrated with the silver system to avoid the problems of limited process windows encountered with base metal systems. A number of solid materials capable of selectively etching silicon dioxide at modest temperatures were identified. A paste with silver fluoride was screened onto N-type silicon with 5 ohm cm resistivity. The resulting contact pads had excellent adhesion but were not electrically ohmic. Metallurgically, these contacts have equal or better grain structure as commercial inks fired at the same temperatures.

  11. Enhanced piezoelectric performance of composite sol-gel thick films evaluated using piezoresponse force microscopy.

    PubMed

    Liu, Yuanming; Lam, Kwok Ho; Kirk Shung, K; Li, Jiangyu; Zhou, Qifa

    2013-05-14

    Conventional composite sol-gel method has been modified to enhance the piezoelectric performance of ceramic thick films. Lead zirconate titanate (PZT) and lead magnesium niobate-lead titanate (PMN-PT) thick films were fabricated using the modified sol-gel method for ultrasonic transducer applications. In this work, piezoresponse force microscopy was employed to evaluate the piezoelectric characteristics of PZT and PMN-PT composite sol-gel thick films. The images of the piezoelectric response and the strain-electric field hysteresis loop behavior were measured. The effective piezoelectric coefficient (d33,eff) of the films was determined from the measured loop data. It was found that the effective local piezoelectric coefficient of both PZT and PMN-PT composite films is comparable to that of their bulk ceramics. The promising results suggest that the modified composite sol-gel method is a promising way to prepare the high-quality, crack-free ceramic thick films.

  12. The Effect of Film-Thickness Nonuniformity on In-Situ Wafer-Curvature Measurements of Thin-Film Stress

    NASA Astrophysics Data System (ADS)

    Lee, Stephen; Breiland, William; Koleske, Dan

    2003-03-01

    Wafer-curvature measurements of thin-film stress during chemical-vapor deposition of epitaxial GaN films on sapphire substrates are made using a multi-beam optical stress sensor (MOSS). The stress measurements are impacted by thickness nonuniformities in the growing film; lateral variations in film thickness produce optical diffraction effects that steer the reflected laser beams of the MOSS sensor away from the normally specular direction. These unintended beam-steering effects oscillate with film thickness and superimpose on the desired time-dependent beam deflections due to the wafer-curvature produced by true stress variations in the growing film. The oscillations can substantially impact stress-measurement accuracy, but allow the film nonuniformity to be assessed in real time. We develop a Fresnel-Kirchhoff diffraction model of laser-beam steering by nonuniform films that we compare to MOSS wafer-curvature measurements. Steering effects vary with the degree of film nonuniformity, the film thickness, the wavelength dispersion of the light source, the illuminated spot size, and the refractive indices of the film and substrate. Lockheed-Martin operates Sandia National Laboratories for the U. S. Dept. of Energy (Contract No. DE-AC04-94AL85000).

  13. Preparation and characterisation of novel thick sol-gel titania film photocatalysts.

    PubMed

    Mills, Andrew; Elliott, Nicholas; Hill, George; Fallis, David; Durrant, James R; Willis, Richard L

    2003-05-01

    The preparation and characterization of thick (9 microns), clear, mechanically robust and photocatalytically active films of nanocrystalline anatase titania are described. XRD and SEM analysis show the films comprise 13 nm particles of anatase TiO2. Thin (54 nm) films of the 'paste' TiO2, along with sol-gel titania films made by a more traditional route are also prepared and characterised. All titania films mediate the photocatalytic destruction of stearic acid with a quantum yield of 0.0016 +/- 0.0003, using either 365 nm (i.e. BLB) or 254 nm (germicidal) light. P25 TiO2 films also appear to mediate the same process with a similar formal quantum efficiency. Of all the films tested, the thick paste TiO2 films are the most ideally suited for use with near UV light, for reasons which are discussed. All the titania films tested exhibit photoinduced superhydrophilicity.

  14. Film Thickness and Flow Properties of Resin-Based Cements at Different Temperatures

    PubMed Central

    Bagheri, R

    2013-01-01

    Statement of Problem: For a luting agent to allow complete seating of prosthetic restorations, it must obtain an appropriate flow rate maintaining a minimum film thickness. The performance of recently introduced luting agents in this regard has not been evaluated. Purpose: To measure and compare the film thickness and flow properties of seven resin-containing luting cements at different temperatures (37°C, 25°C and10°C). Material and Methods: Specimens were prepared from five resin luting cements; seT (SDI), Panavia F (Kuraray), Varioloink II (Ivoclar), Maxcem (Kerr), Nexus2 (Kerr) and two resin-modified glass-ionomer luting cements (RM-GICs); GC Fuji Plus (GC Corporation), and RelyX Luting 2 (3 M/ESPE). The film thickness and flow rate of each cement (n=15) was determined using the test described in ISO at three different temperatures. Results: There was a linear correlation between film thickness and flow rate for most of the materials. Cooling increased fluidity of almost all materials while the effect of temperature on film thickness was material dependent. At 37°C, all products revealed a film thickness of less than 25µm except for GC Fuji Plus. At 25°C, all cements produced a film thickness of less than 27 µm except for seT. At 10°C, apart from seT and Rely X Luting 2, the remaining cements showed a film thickness smaller than 20 µm. Conclusion: Cooling increased fluidity of almost all materials, however. the film thickness did not exceed 35 µm in either condition, in spite of the lowest film thickness being demonstrated at the lowest temperature. PMID:24724120

  15. Experimental study of the polymer powder film thickness uniformity produced by the corona discharge

    NASA Astrophysics Data System (ADS)

    Fazlyyyakhmatov, Marsel

    2017-01-01

    The results of an experimental study of the polymer powder film thickness uniformity are presented. Polymer powder films are produced by the electrostatic field of corona discharge. Epoxy and epoxy-polyester powder films with thickness in the range of 30-120 microns are studied. Experimentally confirmed possibility of using these coatings as protective matching layer of piezoceramic transducers at frequencies of 0.5-15 MHz.

  16. Structure and laser-fabrication mechanisms of microcones on silver films of variable thickness

    NASA Astrophysics Data System (ADS)

    Danilov, P. A.; Zayarny, D. A.; Ionin, A. A.; Kudryashov, S. I.; Nguyen, T. T. H.; Rudenko, A. A.; Saraeva, I. N.; Kuchmizhak, A. A.; Vitrik, O. B.; Kulchin, Yu. N.

    2016-04-01

    Submicron dimensions, nanoscale crystalline structure, and fabrication mechanisms of microcones on silver films of variable (50-380 nm) thickness deposited onto glass substrates by single strongly focused femtosecond laser pulses of different fluences are experimentally studied using scanning electron microscopy. Fabrication mechanisms for nanoholes and microcones are discussed for films of the different thickness, as well as the extraordinary shapes of their constituent nanocrystallites, strongly elongated along the melt flow direction in thin films.

  17. Relationships between processing temperature and microstructure in isothermal melt processed Bi-2212 thick films

    NASA Astrophysics Data System (ADS)

    Holesinger, T. G.; Phillips, D. S.; Willis, J. O.; Peterson, D. E.

    The microstructure and phase assemblage of isothermal melt processed (IMP) Bi(2)Sr(2)CaCu(2)O(y) (Bi-2212) thick films have been evaluated. Results from compositional analysis and phase identification indicate that the characteristics of the partial melt greatly influence the microstructural and chemical development of the thick films. The highest critical current densities were obtained in films processed below 800 C where the partial melt uniformly coats the substrate without excessive phase segregation.

  18. [A reflection interference method for determining optical constants and thickness of a thin solid film].

    PubMed

    Yang, P; Xu, Z; Xu, L

    2000-06-01

    In this paper we report a simple method for deducing optical constants and thickness from the reflection interference spectrum of a thin transparent film which is on a substrate of high reflection coefficient. When a light beam is incident on the surface of the film, the reflection light beams at the front and rear faces are coherent. We calculated the optical constants and thickness of the film from the reflection spectrum. This simple method makes a directly programmable calculation possible.

  19. Measuring the Thickness and Elastic Properties of Electroactive Thin-Film Polymers Using Platewave Dispersion Data

    NASA Technical Reports Server (NTRS)

    Bar-Cohen, Yoseph; Lih, Shyh-Shiuh; El-Azab, A.; Mal, Ajit K.

    1996-01-01

    Electroactive thin-film polymers are candidate sensors and actuators materials. They are also finding significant potential in muscle mechanisms and microelectromechanical systems (MEMS). In these applications, polymer thin films of thickness varying between 20 and 300 micrometers are utilized. The authors are currently studying the potential use of platewave dispersion curve measurements as an effective gauging tool for electroactive thin-film polymers.

  20. Thickness Dependence of Properties of ITO Films Deposited on PET Substrates.

    PubMed

    Kim, Seon Tae; Kim, Tae Gyu; Cho, Hyun; Yoon, Su Jong; Kim, Hye Sung; Kim, Jin Kon

    2016-02-01

    Indium tin oxide (ITO) films with various thicknesses from 104 nm to 513 nm were prepared onto polyethylene terephthalate (PET) substrates by using r.f. magnetron sputtering without intentionally heating the substrates. The structural, optical, and electrical properties of ITO films were investigated as a function of film thickness. It was found that the amorphous nature of the ITO film was dominant below the thickness of about 200 nm but the degree of the crystallinity increased with an increasing thickness above the thickness of about 250 nm, resulting in the increase of carrier concentration and therefore reducing the electrical resistivity from 5.1 x 10(-3) to 9.4 x 10(-4) omega x cm. The average transmittance (400-800 nm) of the ITO deposited PET substrates decreased as the film thickness was increasing and was above 80% for the thickness below 315 nm. The results show that the improvement of the film crystallinity with the film thickness contributes to the increase of the carrier concentration and the enhancement of the electrical conductivity.

  1. Effects of copolymer composition, film thickness, and solvent vapor annealing time on dewetting of ultrathin block copolymer films.

    PubMed

    Huang, Changchun; Wen, Gangyao; Li, Jingdan; Wu, Tao; Wang, Lina; Xue, Feifei; Li, Hongfei; Shi, Tongfei

    2016-09-15

    Effects of copolymer composition, film thickness, and solvent vapor annealing time on dewetting of spin-coated polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) films (<20nm thick) were mainly investigated by atomic force microscopy. Surface chemical analysis of the ultrathin films annealed for different times were performed using X-ray photoelectron spectroscopy and contact angle measurement. With the annealing of acetone vapor, dewetting of the films with different thicknesses occur via the spinodal dewetting and the nucleation and growth mechanisms, respectively. The PS-b-PMMA films rupture into droplets which first coalesce into large ones to reduce the surface free energy. Then the large droplets rupture into small ones to increase the contact area between PMMA blocks and acetone molecules resulting from ultimate migration of PMMA blocks to droplet surface, which is a novel dewetting process observed in spin-coated films for the first time.

  2. An all-metallic logic gate based on current-driven domain wall motion.

    PubMed

    Xu, Peng; Xia, Ke; Gu, Changzhi; Tang, Ling; Yang, Haifang; Li, Junjie

    2008-02-01

    The walls of magnetic domains can become trapped in a ferromagnetic metallic point contact when the thickness of the film and the width of the contact are less than their critical values. The discovery that domain walls can be moved from such constrictions by a sufficiently large current has attracted considerable attention from researchers working on both fundamental research and potential applications. Here we show that Invar nanocontacts fabricated on silica substrates exhibit a sharp drop in resistance with increasing bias voltage at room temperature in the absence of an applied magnetic field. Moreover, when two nanocontacts are combined in an all-metallic comparison circuit, it is possible to perform logical NOT operations. The use of electrical currents rather than applied magnetic fields to control the domain walls also reduces energy consumption and the risk of crosstalk in devices.

  3. Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry.

    PubMed

    Yersak, Alexander S; Lewis, Ryan J; Tran, Jenny; Lee, Yung C

    2016-07-13

    Reflectometry was implemented as an in situ thickness measurement technique for rapid characterization of the dissolution dynamics of thin film protective barriers in elevated water temperatures above 100 °C. Using this technique, multiple types of coatings were simultaneously evaluated in days rather than years. This technique enabled the uninterrupted characterization of dissolution rates for different coating deposition temperatures, postdeposition annealing conditions, and locations on the coating surfaces. Atomic layer deposition (ALD) SiO2 and wet thermally grown SiO2 (wtg-SiO2) thin films were demonstrated to be dissolution-predictable barriers for the protection of metals such as copper. A ∼49% reduction in dissolution rate was achieved for ALD SiO2 films by increasing the deposition temperatures from 150 to 300 °C. ALD SiO2 deposited at 300 °C and followed by annealing in an inert N2 environment at 1065 °C resulted in a further ∼51% reduction in dissolution rate compared with the nonannealed sample. ALD SiO2 dissolution rates were thus lowered to values of wtg-SiO2 in water by the combination of increasing the deposition temperature and postdeposition annealing. Thin metal films, such as copper, without a SiO2 barrier corroded at an expected ∼1-2 nm/day rate when immersed in room temperature water. This measurement technique can be applied to any optically transparent coating.

  4. Intrinsic flux pinning mechanisms in different thickness MgB2 films

    NASA Astrophysics Data System (ADS)

    Yang, C.; Ni, Z. M.; Guo, X.; Hu, H.; Wang, Y.; Zhang, Y.; Feng, Q. R.; Gan, Z. Z.

    2017-03-01

    MgB2 films in four thickness (60 nm, 200nm, 600nm and 1μm) have been fabricated by hybrid physical-chemical vapor deposition technique (HPCVD). By measuring the magnetization hysteresis loops and the resistivity, we have obtained the transport and magnetic properties of the four films. After that, the pinning mechanisms in them were discussed. Comparing the pinning behaviors in these ultrathin films, thin films and thick films, it was found that there exist different pinning types in MgB2 films of different thickness. In combination with the study of the surface morphology, cross-section and XRD results, we concluded that MgB2 films had different growth modes in different growth stages. For thin films, films grew along c axis, and grain boundaries acted as surface pinning. While for thick films, films grew along c axis at first, and then changed to a-b axis growth. As a result, the a-b axis grains acted as strong volume pinning.

  5. Film Thickness Influences on the Thermoelectric Properties of NiCr/NiSi Thin Film Thermocouples

    NASA Astrophysics Data System (ADS)

    Chen, Y. Z.; Jiang, H. C.; Zhang, W. L.; Liu, X. Z.; Jiang, S. W.

    2013-06-01

    NiCr/NiSi thin film thermocouples (TFTCs) with a multi-layer structure were fabricated on Ni-based superalloy substrates (95 mm × 35 mm × 2 mm) by magnetron sputtering and electron beam evaporation. The five-layer structure is composed of NiCrAlY buffer layer (2 μm), thermally grown Al2O3 bond layer (200 nm), Al2O3 insulating layer (10 μm), NiCr/NiSi TFTCs (1 μm), and Al2O3 protective layer (500 nm). Influences of thermocouple layer thickness on thermoelectric properties were investigated. Seebeck coefficient of the samples with the increase in thermocouple layer thickness from 0.5 μm to 1 μm increased from 27.8 μV/°C to 33.8 μV/°C, but exhibited almost no change with further increase in thermocouple layer thickness from 1 μm to 2 μm. Dependence on temperature of the thermal electromotive force of the samples almost followed standard thermocouple characteristic curves when the thickness of the thermocouple layer was 1 μm and 2 μm. Sensitive coefficient K of the samples increased greatly with the increase in thickness of the thermocouple layer from 0.5 μm to 1 μm, but decreased insignificantly with the increase in thermocouple layer thickness from 1 μm to 2 μm, and continuously decreased with the increase in temperature. The sensitive coefficient and the stability of NiCr/NiSi TFTCs were both improved after annealing at 600°C.

  6. Photo- and thermally induced changes in the refractive index and film thickness of amorphous As2S8 film

    NASA Astrophysics Data System (ADS)

    Zou, L. E.; Chen, B. X.; Du, L. P.; Hamanaka, H.; Iso, M.

    2008-06-01

    Changes in the refractive index and thickness of amorphous As2S8 semiconductor film are observed under illumination, annealing-illumination, and annealing-illumination cycles. Properties of the As2S8 film are measured using techniques of prism coupler, x-ray diffraction spectra and Raman spectra. After light illumination the refractive index change in an as-deposited As2S8 film is one order of magnitude greater than that of an annealed As2S8 film, corresponding to ˜0.06 and ˜0.0057, respectively. Photoexpansions with a change in the relative film thickness of the as-deposited and annealed As2S8 film are nearly -3.5% and -2.1%, respectively, which exhibit the photodensification. The full reversibility of the photoinduced refractive index change is claimed on an annealed As2S8 film sample.

  7. The preparation, processing and properties of thin and thick films for microelectric applications

    NASA Astrophysics Data System (ADS)

    Bagley, B. G.; Greene, L. H.; Barboux, P.; Tarascon, J. M.; Venkatesan, T.

    High-Tc thin and thick films of YBa2Cu2O(7-y) and thick films based on the Bi-Sr-Ca-Cu and Tl-Ba-Ca-Cu systems were prepared and their properties investigated. It was found that YB2Cu3O(7-y) thin films prepared at temperatures up to 400 C, have amorphous structures, and those prepared in the 400-650 C region exhibit polyphase microstructure, due to the rapid crystallization kinetics of the competing phases. Methods for bipassing the 'forbidden' temperature region are described. Preparation of YBa2Cu2O(7-y) thick films was achieved via an aqueous sol-gel technique. Bi-Sr-Ca-Cu- and Tl-Ba-Ca-Cu-based thick films were prepared via the decomposition of glycerol-based solutions containing nitrates of the elements.

  8. Correlation of Gear Surface Fatigue Lives to Lambda Ratio (Specific Film Thickness)

    NASA Technical Reports Server (NTRS)

    Krantz, Timothy Lewis

    2013-01-01

    The effect of the lubrication regime on gear performance has been recognized, qualitatively, for decades. Often the lubrication regime is characterized by the specific film thickness being the ratio of lubricant film thickness to the composite surface roughness. Three studies done at NASA to investigate gearing pitting life are revisited in this work. All tests were done at a common load. In one study, ground gears were tested using a variety of lubricants that included a range of viscosities, and therefore the gears operated with differing film thicknesses. In a second and third study, the performance of gears with ground teeth and superfinished teeth were assessed. Thicker oil films provided longer lives as did improved surface finish. These datasets were combined into a common dataset using the concept of specific film thickness. This unique dataset of more 258 tests provides gear designers with some qualitative information to make gear design decisions.

  9. Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement.

    PubMed

    Lunácek, Jiri; Hlubina, Petr; Lunácková, Milena

    2009-02-10

    A method to determine the thickness of a nonabsorbing thin film on an absorbing substrate is presented. A linear relation between the thin-film thickness and the tangent wavelength of the reflectance spectrum for a specific interference order is revealed, which permits the calculation of the thickness provided that the wavelength-dependent optical parameters of the thin film and the substrate are known. The thickness can be calculated precisely from the reflectance spectrum by using one extreme only, as is demonstrated theoretically for SiO(2) thin film on a Si substrate. The application of this method is demonstrated experimentally for the same thin-film structure but with different Si substrates. The results are compared with those given by the algebraic fitting method, and very good agreement is confirmed.

  10. Effective method to study the thickness-dependent dielectric functions of nanometal thin film.

    PubMed

    Hu, Er-Tao; Cai, Qing-Yuan; Zhang, Rong-Jun; Wei, Yan-Feng; Zhou, Wen-Chao; Wang, Song-You; Zheng, Yu-Xiang; Wei, Wei; Chen, Liang-Yao

    2016-11-01

    A new method for measuring the dielectric functions change with the thickness of nanometal thin films was proposed. To confirm the accuracy and reliability of the method, a nano-thin wedge-shaped gold (Au) film with continuously varied thicknesses was designed and prepared on K9 glass by direct-current-sputtering (DC-sputtering). The thicknesses and the dielectric functions in the wavelength range of 300-1100 nm of the nano-thin Au films were obtained by fitting the ellipsometric parameters with the Drude and critical points model. Results show that while the real part of the dielectric function (ϵ1) changes marginally with increasing film thickness, the imaginary part (ϵ2) decreases drastically with the film thickness, approaching a stable value when the film thickness increases up to about 42 nm. This method is particularly useful in the study of thickness-dependent optical properties of nano-thin film.

  11. Non-contacting Measurement of Oil Film Thickness Between Loaded Metallic Gear Teeth

    NASA Astrophysics Data System (ADS)

    Cox, Daniel B.; Ceccio, Steven L.; Dowling, David R.

    2013-11-01

    The mechanical power transmission efficiency of gears is depends on the lubrication condition between gear teeth. While the lubrication levels can be generally predicted, an effective in-situ non-contacting measurement of oil film thicknesses between loaded metallic gear teeth has proved elusive. This study explores a novel oil film thickness measurement technique based on optical fluence, the light energy transmitted between loaded gear teeth. A gear testing apparatus that allowed independent control of gear rotation rate, load torque, and oil flow was designed and built. Film thickness measurements made with 5-inch-pitch-diameter 60-tooth spur gears ranged from 0.3 to 10.2 mil. These results are compared with film thickness measurements made in an earlier investigation (MacConochie and Cameron, 1960), as well as with predictions from two film thickness models: a simple two-dimensional squeezed oil film and the industry-accepted model as described by the American Gear Manufacturers Association (AGMA 925, 2003). In each case, the measured film thicknesses were larger than the predicted thicknesses, though these discrepancies might be attributed to the specifics the experiments and to challenges associated with calibrating the fluence measurements. [Sponsored by General Electric].

  12. Effect of Nanotube Film Thickness on the Performance of Nanotube-Silicon Hybrid Solar Cells

    PubMed Central

    Tune, Daniel D.; Shapter, Joseph G.

    2013-01-01

    The results of measurements on solar cells made from randomly aligned thin films of single walled carbon nanotubes (SWCNTs) on n-type monocrystalline silicon are presented. The films are made by vacuum filtration from aqueous TritonX-100 suspensions of large diameter arc-discharge SWCNTs. The dependence of the solar cell performance on the thickness of the SWCNT film is shown in detail, as is the variation in performance due to doping of the SWCNT film with SOCl2.

  13. Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films

    NASA Astrophysics Data System (ADS)

    Ulutas, K.; Deger, D.; Yakut, S.

    2013-03-01

    Sb2Te3 thin films of different thickness (23 - 350 nm) were prepared by thermal evaporation technique. The thickness dependence of the ac conductivity and dielectric properties of the Sb2Te3 films have been investigated in the frequency range 10 Hz- 100 kHz and within the temperature range 293-373K. Both the dielectric constant epsilon1 and dielectric loss factor epsilon2 were found to depend on frequency, temperature and film thickness. The frequency and temperature dependence of ac conductivity (σac(ω)) has also been determined. The ac conductivity of our samples satisfies the well known ac power law; i.e., σac(ω) propto ωs where s<1 and independent of the film thickness. The temperature dependence of ac conductivity and parameter s is reasonably well interpreted by the correlated barrier hopping (CBH) model. The activation energies were evaluated for various thicknesses. The temperature coefficient of the capacitance (TCC) and permitivity (TCP) were determined as a function of the film thickness. The microstructure of the samples were analyzed using X-ray diffraction (XRD). This results are discussed on the base of the differences in their morphologies and thicknesses. The tendency for amorphization of the crystalline phases becomes evident as the film thickness increases.

  14. Field electron emission from undoped, continuous, submicron-thick diamond films

    NASA Astrophysics Data System (ADS)

    Ternyak, O.; Akhvlediani, R.; Hoffman, A.; Wong, W. K.; Lee, S. T.; Lifshitz, Y.; Daren, S.; Cheifetz, E.

    2005-12-01

    The present work shows that the field electron emission (FEE) properties of polycrystalline diamond films can be enhanced by control over the film thickness. The FEE properties of undoped, continuous, and smooth submicron-thick diamond films with initial nucleation densities of ˜5×1010particles/cm2 were investigated as a function of diamond film thickness. A set of films with thickness ranging from 70-100to830nm yielded turn-on field values of 6-8V/μm and threshold field values of 8.5-17.5V/μm (for 0.3μA/cm2), respectively, without any conditioning. It was found that the films of thickness up to ˜370nm can sustain stable current density as high as 0.1A/cm2 without morphological modification. The thicker films, however, suffer from a strong degradation of the film and breakdown. The best FEE (lower turn-on and threshold fields and morphological stability) was obtained for a thin (100nm) continuous diamond film. This result is suggested to be attributed mainly to the efficient electron conduction from the back contact to the surface.

  15. Change in Tear Film Lipid Layer Thickness, Corneal Thickness, Volume and Topography after Superficial Cauterization for Conjunctivochalasis.

    PubMed

    Chan, Tommy C Y; Ye, Cong; Ng, Paul K F; Li, Emmy Y M; Yuen, Hunter K L; Jhanji, Vishal

    2015-07-17

    We evaluated the change in tear film lipid layer thickness, corneal thickness, volume and topography after superficial cauterization of symptomatic conjunctivochalasis. Bilateral superficial conjunctival cauterization was performed in 36 eyes of 18 patients with symptomatic conjunctivochalasis. The mean age of patients (12 males, 6 females) was 68.6 ± 10.9 years (range: 44-83 years). Preoperatively, 28 eyes (77.8%) had grade 1 conjunctivochalasis, and 8 eyes (22.2%) had grade 2 conjunctivochalasis. At 1 month postoperatively, the severity of conjunctivochalasis decreased significantly (p < 0.001) and 29 eyes (80.6%) had grade 0 conjunctivochalasis whereas 7 eyes (19.4%) had grade 1 conjunctivochalasis. The mean Ocular Surface Disease Index score decreased from 31.5 ± 15.2 preoperatively to 21.5 ± 14.2 at the end of 1 month postoperatively (p = 0.001). There was a statistically significant increase in mean tear film lipid layer thickness 1 month after the surgery (49.6 ± 16.1 nm vs 62.6 ± 21.6 nm; p < 0.001). The central corneal thickness, thinnest corneal thickness and corneal volume decreased significantly postoperatively (p < 0.001). Our study showed that superficial conjunctival cauterization is an effective technique for management of conjunctivochalasis in the short term. An increase in tear film lipid layer thickness along with a decrease in corneal thickness and volume were observed after surgical correction of conjunctivochalasis.

  16. Optical coefficients of nanometer-thick copper and gold films in microwave frequency range

    NASA Astrophysics Data System (ADS)

    Khorin, I.; Orlikovsky, N.; Rogozhin, A.; Tatarintsev, A.; Pronin, S.; Andreev, V.; Vdovin, V.

    2016-12-01

    Ultrathin (1-10 nm) Cu and Au films were prepared on the silicon and quartz substrates by magnetron sputtering at room temperature. We measured the transmission coefficient of the films at a wavelength of 3cm and analyzed a surface morphology of these films. It was shown that the films with thicknesses less than 7.5 nm (Au) and 3 nm (Cu) are almost transparent for microwaves. This effect is explained by quick oxidation of Cu and the complex surface morphology of nanometer thick films. The Au film morphology is evolved with increasing average Au thickness d from hemispherical islands initially (1.0 nm

  17. Realistic reflectance spectrum of thin films covering a transparent optically thick substrate

    SciTech Connect

    Cesaria, M. Caricato, A. P.; Martino, M.

    2014-07-21

    A spectrophotometric strategy is presented and discussed for calculating realistically the reflectance spectrum of an absorbing film deposited over a thick transparent or semi-transparent substrate. The developed route exploits simple mathematics, has wide range of applicability (high-to-weak absorption regions and thick-to-ultrathin films), rules out numerical and curve-fitting procedures as well as model-functions, inherently accounts for the non-measurable contribution of the film-substrate interface as well as substrate backside, and describes the film reflectance spectrum as determined by the experimental situation (deposition approach and parameters). The reliability of the method is tested on films of a well-known material (indium tin oxide) by deliberately changing film thickness and structural quality through doping. Results are found consistent with usual information yielded by reflectance, its inherent relationship with scattering processes and contributions to the measured total reflectance.

  18. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements.

    PubMed

    Cardin, Julien; Leduc, Dominique

    2008-03-01

    We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.

  19. Thin-film thickness profile measurement by three-wavelength interference color analysis.

    PubMed

    Kitagawa, Katsuichi

    2013-04-01

    Conventional transparent film thickness measurement methods such as spectroscopy are essentially capable of measuring only a single point at a time, and their spatial resolution is limited. We propose a film thickness measurement method that is an extension of the global model-fitting algorithm developed for three-wavelength interferometric surface profiling. It estimates the film thickness distribution from an interference color image captured by a color camera with three-wavelength illumination. The proposed method is validated through computer simulations and experiments.

  20. Application of Fresnel diffraction from a phase step to the measurement of film thickness

    SciTech Connect

    Taghi Tavassoly, Mohammad; Moaddel Haghighi, Iman; Hassani, Khosrow

    2009-10-10

    When a thin film that is prepared in a step form on a substrate and coated uniformly with a reflective material is illuminated by a parallel coherent beam of monochromatic light, the Fresnel diffraction fringes are formed on a screen perpendicular to the reflected beam. The visibility of the fringes depends on film thickness, angle of incidence, and light wavelength. Measuring visibility versus incident angle provides the film thickness with an accuracy of a few nanometers. The technique is easily applicable and it covers a wide range of thicknesses with highly reliable results.

  1. Application of Fresnel diffraction from a phase step to the measurement of film thickness.

    PubMed

    Taghi Tavassoly, Mohammad; Moaddel Haghighi, Iman; Hassani, Khosrow

    2009-10-10

    When a thin film that is prepared in a step form on a substrate and coated uniformly with a reflective material is illuminated by a parallel coherent beam of monochromatic light, the Fresnel diffraction fringes are formed on a screen perpendicular to the reflected beam. The visibility of the fringes depends on film thickness, angle of incidence, and light wavelength. Measuring visibility versus incident angle provides the film thickness with an accuracy of a few nanometers. The technique is easily applicable and it covers a wide range of thicknesses with highly reliable results.

  2. Active brazing alloy paste as a totally metal thick film conductor material

    NASA Astrophysics Data System (ADS)

    Zhu, Mingguang; Chung, D. D. L.

    1994-06-01

    A silver-based active (titanium-containing) brazing alloy, namely 63Ag-34.25Cu-1.75Ti-1.OSn, was found to serve as a totally metal (no glass) thick film conductor which exhibited lower electrical resistivity, much greater film/substrate adhesion, much lower porosity, similar solderability, and lower scratch resistance compared to the conventional silver-glass thick film. The brazing alloy film was formed by screen printing a paste containing the alloy particles and then firing at 880°C in vacuum.

  3. Ptychographic Imaging of Branched Colloidal Nanocrystals Embedded in Free-Standing Thick Polystyrene Films

    PubMed Central

    De Caro, Liberato; Altamura, Davide; Arciniegas, Milena; Siliqi, Dritan; Kim, Mee R.; Sibillano, Teresa; Manna, Liberato; Giannini, Cinzia

    2016-01-01

    Research on composite materials is facing, among others, the challenging task of incorporating nanocrystals, and their superstructures, in polymer matrices. Electron microscopy can typically image nanometre-scale structures embedded in thin polymer films, but not in films that are micron size thick. Here, X-ray Ptychography was used to visualize, with a resolution of a few tens of nanometers, how CdSe/CdS octapod-shaped nanocrystals self-assemble in polystyrene films of 24 ± 4 μm, providing a unique means for non-destructive investigation of nanoparticles distribution and organization in thick polymer films. PMID:26775682

  4. Tailoring of Luminous Transmittance upon Switching for Thermochromic VO2 Films by Thickness Control

    NASA Astrophysics Data System (ADS)

    Xu, Gang; Jin, Ping; Tazawa, Masato; Yoshimura, Kazuki

    2004-01-01

    The difference in luminous transmittance (Δ Tlum) upon switching of VO2 films strongly affects its solar controllability when used as a thermochromic window. It was found that Δ Tlum is controllable by film thickness. Optical calculation for a VO2 film on quartz glass revealed that the low-temperature semiconductor phase exhibits lower Tlum than the high-temperature metallic phase for thickness below 50 nm, while the relationship is reversed above 50 nm. The calculation was confirmed by film deposition and measurement. Maximum Δ Tlum is located near 80 nm. An enhanced Δ Tlum contributes largely to solar efficiency.

  5. In vivo tear film thickness measurement and tear film dynamics visualization using spectral domain OCT and an efficient delay estimator

    NASA Astrophysics Data System (ADS)

    Aranha dos Santos, Valentin; Schmetterer, Leopold; Gröschl, Martin; Garhofer, Gerhard; Werkmeister, René M.

    2016-03-01

    Dry eye syndrome is a highly prevalent disease of the ocular surface characterized by an instability of the tear film. Traditional methods used for the evaluation of tear film stability are invasive or show limited repeatability. Here we propose a new noninvasive approach to measure tear film thickness using an efficient delay estimator and ultrahigh resolution spectral domain OCT. Silicon wafer phantoms with layers of known thickness and group index were used to validate the estimator-based thickness measurement. A theoretical analysis of the fundamental limit of the precision of the estimator is presented and the analytical expression of the Cramér-Rao lower bound (CRLB), which is the minimum variance that may be achieved by any unbiased estimator, is derived. The performance of the estimator against noise was investigated using simulations. We found that the proposed estimator reaches the CRLB associated with the OCT amplitude signal. The technique was applied in vivo in healthy subjects and dry eye patients. Series of tear film thickness maps were generated, allowing for the visualization of tear film dynamics. Our results show that the central tear film thickness precisely measured in vivo with a coefficient of variation of about 0.65% and that repeatable tear film dynamics can be observed. The presented method has the potential of being an alternative to breakup time measurements (BUT) and could be used in clinical setting to study patients with dry eye disease and monitor their treatments.

  6. Impressive electromagnetic shielding effects exhibited by highly ordered, micrometer thick polyaniline films

    NASA Astrophysics Data System (ADS)

    Mohan, Ranjini R.; Varma, Sreekanth J.; Sankaran, Jayalekshmi

    2016-04-01

    The present work highlights the remarkably high shielding effectiveness of about 68 dB, exhibited by highly ordered and doped polyaniline films, in the microwave frequency range 4-12 GHz, obtained by self-stabilized dispersion polymerization as the synthesis route. The observed shielding effectiveness is found to depend quite sensitively on the electrical conducting properties, which are predominantly controlled by the nature and concentration of the dopants. The structural and morphological characterization of the films using XRD and TEM techniques reveals surprisingly high extent of crystallinity, which contributes significantly towards enhancing the electrical conductivity of the films. Most of the available reports on the microwave response of conducting polymer film samples deal with much thicker films, compared to the micrometer thick films of the present studies. The shielding effectiveness of acid doped, micrometer thick polyaniline films reported in the present work far exceeds most of the previously reported values and meets the commercial requirements.

  7. Thickness-dependent glass transition temperature and charge mobility in cross-linked polyfluorene thin films

    NASA Astrophysics Data System (ADS)

    Liu, Dan; Qin, Hui; Zhang, Jinghui; Wang, Tao

    2016-11-01

    We report thickness-dependent glass transition temperature (Tg) and charge mobility in cross-linked thin films made of conjugated polymer poly(9,9-dioctylfluorene-co-N -(4-butylphenyl)diphenylamine) (TFB). Monotonic Tg depressions with reducing film thickness in thermally and UV cross-linked TFB thin films supported on Si-SiOx substrates are observed through ellipsometry measurements, suggesting that a surface mobile layer with enhanced chain dynamics still exists in cross-linked TFB thin films, even with a high cross-linking percentage. Data fitting using a three-layer model shows that the Tg in the interface, bulk and surface layer both increases with increasing cross-linking, while the thickness of the interface and surface layer increases and reduces, respectively. Cross-linking of TFB thin film generates traps that hinder charge transport and consequently reduce charge mobility. The charge mobility converges in thick (>140 nm) and thin (<40 nm) TFB films but shows strong thickness dependence in between, reducing from 4.0 ×10-4c m2/V s in a 180-nm film to 0.1 ×10-4c m2/V s in a 20-nm thin film.

  8. Development of economical improved thick film solar cell contact

    NASA Technical Reports Server (NTRS)

    Ross, B.

    1979-01-01

    Metal screened electrodes were investigated with base metal pastes and silver systems being focused upon. Contact resistance measurements were refined. A facility allowing fixing in hydrogen and other atmospheres was acquired. Several experiments were made applying screenable pastes to solar cells. Doping investigations emphasized eutectic alloys reduced to powders. Metal systems were reviewed and base metal experiments were done with nickel and copper using lead and tin as the frit metals. Severe adhesion problems were experienced with hydrogen atmospheres in all metal systems. A two step firing schedule was devised. Aluminum-silicon and aluminum-germanium eutectic doping additions to copper pastes were tried on 2 1/4 in diameter solar cell back contacts, both with good results.

  9. Amorphous Indium Selenide Thin Films Prepared by RF Sputtering: Thickness-Induced Characteristics.

    PubMed

    Han, Myoung Yoo; Park, Yong Seob; Kim, Nam-Hoon

    2016-05-01

    The influence of indium composition, controlled by changing the film thickness, on the optical and electrical properties of amorphous indium selenide thin films was studied for the application of these materials as Cd-free buffer layers in CI(G)S solar cells. Indium selenide thin films were prepared using RF magnetron sputtering method. The indium composition of the amorphous indium selenide thin films was varied from 94.56 to 49.72 at% by increasing the film thickness from 30 to 70 nm. With a decrease in film thickness, the optical transmittance increased from 87.63% to 96.03% and Eg decreased from 3.048 to 2.875 eV. Carrier concentration and resistivity showed excellent values of ≥1015 cm(-3) and ≤ 10(4) Ω x cm, respectively. The conductivity type of the amorphous indium selenide thin films could be controlled by changing the film-thickness-induced amount of In. These results indicate the possibility of tuning the properties of amorphous indium selenide thin films by changing their composition for use as an alternate buffer layer material in CI(G)S solar cells.

  10. Thickness dependence of Jc (0) in MgB2 films

    NASA Astrophysics Data System (ADS)

    Chen, Yiling; Yang, Can; Jia, Chunyan; Feng, Qingrong; Gan, Zizhao

    2016-06-01

    MgB2 superconducting films, whose thicknesses range from 10 nm to 8 μm, have been fabricated on SiC substrates by hybrid physical-chemical vapor deposition (HPCVD) method. It is the first time that the Tc and the Jc of MgB2 films are studied on such a large scale. It is found that with the increasing of thickness, Tc elevates first and then keeps roughly stable except for some slight fluctuations, while Jc (5 K, 0 T) experiences a sharp increase followed by a relatively slow fall. The maximum Jc (5 K, 0 T) = 2.3 × 108 A cm-2 is obtained for 100 nm films, which is the experimental evidence for preparing high-quality MgB2 films by HPCVD method. Thus, this work may provide guidance on choosing the suitable thickness for applications. Meanwhile, the films prepared by us cover ultrathin films, thin films and thick films, so the study on them will bring a comprehensive understanding of MgB2 films.

  11. Wavy film flows down an inclined plane: perturbation theory and general evolution equation for the film thickness.

    PubMed

    Frenkel, A L; Indireshkumar, K

    1999-10-01

    Wavy film flow of incompressible Newtonian fluid down an inclined plane is considered. The question is posed as to the parametric conditions under which the description of evolution can be approximately reduced for all time to a single evolution equation for the film thickness. An unconventional perturbation approach yields the most general evolution equation and least restrictive conditions on its validity. The advantages of this equation for analytical and numerical studies of three-dimensional waves in inclined films are pointed out.

  12. Film thickness measurement for spiral groove and Rayleigh step lift pad self-acting face seals

    NASA Technical Reports Server (NTRS)

    Dirusso, E.

    1982-01-01

    One Rayleigh step lift pad and three spiral groove self-acting face seal configurations were tested to measure film thickness and frictional torque as a function of shaft speed. The seals were tested at a constant face load of 73 N (16.4 lb) with ambient air at room temperature and atmospheric pressure as the fluid medium. The test speed range was from 7000 to 17,000 rpm. The measured film thickness was compared with theoretical data from mathematical models. The mathematical models overpredicted the measured film thickness at the lower speeds of the test speed range and underpredicted the measured film thickness at the higher speeds of the test speed range.

  13. Effects of artificially produced defects on film thickness distribution in sliding EHD point contacts

    NASA Technical Reports Server (NTRS)

    Cusano, C.; Wedeven, L. D.

    1981-01-01

    The effects of artificially produced dents and grooves on the elastohydrodynamic (EHD) film thickness profile in a sliding point contact were investigated by means of optical interferometry. The defects, formed on the surface of a highly polished ball, were held stationary at various locations within and in the vicinity of the contact region while the disk was rotating. It is shown that the defects, having a geometry similar to what can be expected in practice, can dramatically change the film thickness which exists when no defects are present in or near the contact. This change in film thickness is mainly a function of the position of the defects in the inlet region, the geometry of the defects, the orientation of the defects in the case of grooves, and the depth of the defect relative to the central film thickness.

  14. Thickness dependence of temperature coefficient of resistivity of polycrystalline bismuth films

    NASA Astrophysics Data System (ADS)

    Kumar, Ajay; Katyal, O. P.

    1991-04-01

    Results for the temperature coefficient of resistivity (TCR) of polycrystalline bismuth films deposited on to glass substrate are reported for the thickness range 30 300 nm. The film TCR is found to be negative for all thicknesses studied and its absolute value exhibits a maximum of 3.70×10-3 K-1 near 72.5 nm. The variation of charge carrier density with film thickness has been estimated from the presence of surface states. To include the thickness dependence of charge carrier density, a modified theory has been used to explain the observed behaviour of the TCR. The experimental results for the TCR of Bi films are found to be consistent with the theoretical values. The existence of the extremum is theoretically verified. From the analysis, the specularity parameter p is about 0.44 and the reflection coefficient R is 0.1.

  15. Research of niobium thin films with a predetermined thickness produced by RF magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Polonyankin, D. A.; Blesman, A. I.; Postnikov, D. V.; Logacheva, A. I.; Logachev, I. A.; Teplouhov, A. A.; Fedorov, A. A.

    2017-01-01

    Niobium and niobium thin films are widely used in various fields of modern science and technology: in the electronics industry, in a nuclear medical imaging technique, in the information technology, in superconducting cavities technology etc. The grain size of thin niobium films depends on its thickness and the film’s stoichiometry can be varied as a function of thickness. Thus the problem of thickness control has a great practical importance in all fields of niobium films application. The focus of this study was to perform an experimental calibration of STC–2000A deposition controller for niobium target on ADVAVAC VSM–200 setup and to conduct a grain size, roughness and stoichiometry research by scanning electron microscopy, X–ray diffraction and laser interference microscopy of niobium films produced by RF magnetron sputtering with the thickness range from 200 nm to 400 nm and 50 nm step.

  16. Moderate repetition rate ultra-intense laser targets and optics using variable thickness liquid crystal films

    NASA Astrophysics Data System (ADS)

    Poole, P. L.; Willis, C.; Cochran, G. E.; Hanna, R. T.; Andereck, C. D.; Schumacher, D. W.

    2016-10-01

    Liquid crystal films are variable thickness, planar targets for ultra-intense laser matter experiments such as ion acceleration. Their target qualities also make them ideal for high-power laser optics such as plasma mirrors and waveplates. By controlling parameters of film formation, thickness can be varied on-demand from 10 nm to above 50 μm, enabling real-time optimization of laser interactions. Presented here are results using a device that draws films from a bulk liquid crystal source volume with any thickness in the aforementioned range. Films form within 2 μm of the same location each time, well within the Rayleigh range of even tight F / # systems, thus removing the necessity for realignment between shots. The repetition rate of the device exceeds 0.1 Hz for sub-100 nm films, facilitating higher repetition rate operation of modern laser facilities.

  17. Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films

    DOE PAGES

    Shen, Xuan; Qiu, Xiangbiao; Su, Dong; ...

    2015-01-06

    Transport characteristics of ultrathin SrRuO₃ films, deposited epitaxially on TiO₂-terminated SrTiO₃ (001) single-crystal substrates, were studied as a function of film thickness. Evolution from a metallic to an insulating behavior is observed as the film thickness decreases from 20 to 4 unit cells. In films thicker than 4 unit cells, the transport behavior obeys the Drude low temperature conductivity with quantum corrections, which can be attributed to weak localization. Fitting the data with 2-dimensional localization model indicates that electron-phonon collisions are the main inelastic relaxation mechanism. In the film of 4 unit cells in thickness, the transport behavior follows variablemore » range hopping model, indicating a strongly localized state. As a result, magnetoresistance measurements reveal a likely magnetic anisotropy with the magnetic easy axis along the out-of-plane direction.« less

  18. Thin film thickness measurement of whole field based on spatial carrier frequency interferometry

    NASA Astrophysics Data System (ADS)

    Su, Junhong; Yang, Lihong; Ge, Jinman

    2009-12-01

    The kernel of modern interferometry is to the obtain necessary surface shape and parameter by processing interferogram with a reasonable algorithm. On the basis of the study the basic principle of interferometry by using 2-D FFT arithmetic, a new method to measure the thin film thickness is proposed based on the FFT algorithm. A test sample is placed into the light path in Twyman-Green interferometer, the interference fringes were generated by the reference beam with the tested beam reflected respectively from the film surface and the substrate surface. The interferogram is collected by the image acquisition system. The algorithm processing software is prepared to realize identification of the films edge, regional extension, filtering, unwrapping the wrapped phase etc, the film thickness distribution in whole field can be obtained to realize the thickness measurement of thin film samples automatically. The results indicate that the new method has the advantages of high precision, whole test and non-contact measurement.

  19. Thin film thickness measurement of whole field based on spatial carrier frequency interferometry

    NASA Astrophysics Data System (ADS)

    Su, Junhong; Yang, Lihong; Ge, Jinman

    2010-03-01

    The kernel of modern interferometry is to the obtain necessary surface shape and parameter by processing interferogram with a reasonable algorithm. On the basis of the study the basic principle of interferometry by using 2-D FFT arithmetic, a new method to measure the thin film thickness is proposed based on the FFT algorithm. A test sample is placed into the light path in Twyman-Green interferometer, the interference fringes were generated by the reference beam with the tested beam reflected respectively from the film surface and the substrate surface. The interferogram is collected by the image acquisition system. The algorithm processing software is prepared to realize identification of the films edge, regional extension, filtering, unwrapping the wrapped phase etc, the film thickness distribution in whole field can be obtained to realize the thickness measurement of thin film samples automatically. The results indicate that the new method has the advantages of high precision, whole test and non-contact measurement.

  20. Moderate repetition rate ultra-intense laser targets and optics using variable thickness liquid crystal films

    DOE PAGES

    Poole, P. L.; Willis, C.; Cochran, G. E.; ...

    2016-10-10

    Liquid crystal films are variable thickness, planar targets for ultra-intense laser matter experiments such as ion acceleration. Their target qualities also make them ideal for high-power laser optics such as plasma mirrors and waveplates. By controlling parameters of film formation, thickness can be varied on-demand from 10 nm to above 50 μm, enabling real-time optimization of laser interactions. Presented here are results using a device that draws films from a bulk liquid crystal source volume with any thickness in the aforementioned range. Films form within 2 μm of the same location each time, well within the Rayleigh range of evenmore » tight F/# systems, thus removing the necessity for realignment between shots. As a result, the repetition rate of the device exceeds 0.1 Hz for sub-100nm films, facilitating higher repetition rate operation of modern laser facilities.« less

  1. Moderate repetition rate ultra-intense laser targets and optics using variable thickness liquid crystal films

    SciTech Connect

    Poole, P. L.; Willis, C.; Cochran, G. E.; Hanna, R. T.; Andereck, C. D.; Schumacher, D. W.

    2016-10-10

    Liquid crystal films are variable thickness, planar targets for ultra-intense laser matter experiments such as ion acceleration. Their target qualities also make them ideal for high-power laser optics such as plasma mirrors and waveplates. By controlling parameters of film formation, thickness can be varied on-demand from 10 nm to above 50 μm, enabling real-time optimization of laser interactions. Presented here are results using a device that draws films from a bulk liquid crystal source volume with any thickness in the aforementioned range. Films form within 2 μm of the same location each time, well within the Rayleigh range of even tight F/# systems, thus removing the necessity for realignment between shots. As a result, the repetition rate of the device exceeds 0.1 Hz for sub-100nm films, facilitating higher repetition rate operation of modern laser facilities.

  2. Structural, transport and microwave properties of 123/sapphire films: Thickness effect

    SciTech Connect

    Predtechensky, MR.; Smal, A.N.; Varlamov, Y.D.

    1994-12-31

    The effect of thickness and growth conditions on the structure and microwave properties has been investigated for the 123/sapphire films. It has been shown that in the conditions of epitaxial growth and Al atoms do not diffuse from substrate into the film and the films with thickness up to 100nm exhibit the excellent DC properties. The increase of thickness of GdBaCuO films causes the formation of extended line-mesh defects and the increase of the surface resistance (R{sub S}). The low value of surface resistance R{sub S}(75GHz,77K)=20 mOhm has been obtained for the two layer YBaCuO/CdBaCuO/sapphire films.

  3. Thermal Effusivity Determination of Metallic Films of Nanometric Thickness by the Electrical Micropulse Method

    NASA Astrophysics Data System (ADS)

    Lugo, J. M.; Oliva, A. I.

    2017-02-01

    The thermal effusivity of gold, aluminum, and copper thin films of nanometric thickness (20 nm to 200 nm) was investigated in terms of the films' thickness. The metallic thin films were deposited onto glass substrates by thermal evaporation, and the thermal effusivity was estimated by using experimental parameters such as the specific heat, thermal conductivity, and thermal diffusivity values obtained at room conditions. The specific heat, thermal conductivity, and thermal diffusivity values of the metallic thin films are determined with a methodology based on the behavior of the thermal profiles of the films when electrical pulses of few microseconds are applied at room conditions. For all the investigated materials, the thermal effusivity decreases with decreased thickness. The thermal effusivity values estimated by the presented methodology are consistent with other reported values obtained under vacuum conditions and more elaborated methodologies.

  4. Surface chemistry and polymer film thickness effects on endothelial cell adhesion and proliferation

    PubMed Central

    Bhattacharyya, Dhiman; Xu, Hao; Deshmukh, Rajendra R.; Timmons, Richard B.; Nguyen, Kytai T.

    2010-01-01

    Adherence and growth rates of human aortic endothelial cells (HAEC) on plasma polymerized poly(vinylacetic acid) films were measured as functions of the surface density of —COOH groups and plasma deposited film thickness. Pulsed plasma polymerization was employed to produce films containing 3.6 to 9% —COOH groups, expressed as a percent of total carbon content. Endothelial cells exhibited increased cell adherence and proliferation with increasing —COOH surface densities. Additionally, and unexpectedly, cell growth was also dependent on the film thicknesses, which ranged from 25 to 200 nm. The results indicate that optimization of the functional group surface density and film thickness could produce significant enhancements in initial adhesion and subsequent growth of the HAEC cells. PMID:20213813

  5. Highly Laminated Soft Magnetic Electroplated CoNiFe Thick Films

    SciTech Connect

    Kim, J; Kim, M; Herrault, F; Park, J; Allen, MG

    2013-01-01

    The fabrication and characterization of highly laminated (similar to 40 layers), thick (similar to 40 mu m) films of magnetically soft cobalt-nickel-iron are presented. Thick film fabrication is based on automated sequential electrodeposition of alternating CoNiFe and copper layers, followed by selective copper removal. The film, comprised tens of 1 mu m thick laminations, exhibits saturation flux density of 1.8 T and coercivity of approximately 1.3 Oe. High-frequency film characterization took place in a 36-turn test inductor, which demonstrated constant inductance of 1.6 mu H up to 10 MHz, indicating suppressed eddy-current loss. Quality factor exceeding 40 at 1 MHz, surpassing the performance of similarly fabricated Permalloy (Ni80Fe20) films.

  6. Structural, transport and microwave properties of 123/sapphire films: Thickness effect

    NASA Technical Reports Server (NTRS)

    Predtechensky, M. R.; Smal, A. N.; Varlamov, Yu. D.; Vatnik, S. M.; Tukhto, O. M.; Vasileva, I. G.

    1995-01-01

    The effect of thickness and growth conditions on the structure and microwave properties has been investigated for the 123/sapphire films. It has been shown that in the conditions of epitaxial growth the Al atoms do not diffuse from substrate into the film and the films with thickness up to 100 nm exhibit the excellent direct current (DC) properties. The increase of thickness of GdBaCuO films causes the formation of extended line-mesh defects and the increase of the surface resistance (R(sub S)). The low value of surface resistance R(sub S)(75 GHz, 77K) = 20 mOhm has been obtained for the two layer YBaCuO/CdBaCuO/sapphire films.

  7. Homoepitaxial growth of MOD-YBCO thick films on evaporated and MOD templates

    NASA Astrophysics Data System (ADS)

    Tanabe, D.; Yamaguchi, I.; Sohma, M.; Tsukada, K.; Matsui, M.; Kumagai, T.; Manabe, T.

    2011-11-01

    We have prepared metal organic deposition (MOD)-YBCO thick films by repeating the coating-pyrolysis-crystallization procedure onto ∼100-nm-thick evaporated and MOD templates. Surface morphology of the template was found to strongly affect the homoepitaxial growth of MOD-YBCO layers on the template; namely, the epitaxial growth of MOD-YBCO on the evaporated template was much easier than that on the MOD template. A 220-nm-thick epitaxial MOD-YBCO film was successfully prepared on the 100-nm-thick evaporated-YBCO template to obtain a 320-nm-thick YBCO film, which exhibited Jc = 2.44 MA/cm2 and Ic = 78 A/cm. The Ic value has significantly increased from 37 A/cm for the evaporated-template.

  8. Preliminary indications of water film distribution and thickness on an airfoil in a water spray

    NASA Technical Reports Server (NTRS)

    Hastings, E. C., Jr.; Weinstein, L. M.

    1984-01-01

    A sensor for measuring water film thickness is evaluated. The test is conducted in a small flow apparatus with a 1 ft chord model wing in a water spray. Photographic and visual observations are made of the upper wing surface and film thickness is measured on the upper and lower wing surfaces. The performance of the sensor appears highly satisfactory, and where valid comparisons can be made, repeatable results are obtained.

  9. Thickness Effect on Properties of Sprayed In2S3 Films for Photovoltaic Applications

    NASA Astrophysics Data System (ADS)

    Bouguila, N.; Kraini, M.; Halidou, I.; Lacaze, E.; Bouchriha, H.; Bouzouita, H.

    2016-01-01

    Indium sulfide (In2S3) films have been deposited on soda-lime glass substrates using a spray technique (CSP). Indium chloride and thiourea were used as precursors at a molar ratio of S:In = 2. The substrate temperature was fixed at 340°C. The effect of film thickness on the structural, morphological and optical properties of the as-deposited films has been studied. These films were characterized by x-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM) and optical absorption spectroscopy. As-prepared samples were polycrystalline with a cubic structure and (400) as preferential orientation. Their grain size increased from 35 nm to 41 nm with increasing thickness whereas the dislocation density and microstrain of the films decreased with the increase of thickness. Both SEM and AFM images showed that the films were homogenous with an increase of the surface roughness with the increase of thickness. The optical transmittance of the films decreased from 80% to 20% in the visible and infrared regions when the thickness was increased from 0.78 μm to 6.09 μm. The optical band gap E g was found to be in the range of 2.75-2.19 eV and showed a decrease with film thickness. Based on the measured optical constants (n and k), a Wemple-Didomenico model was used to determine the values of single oscillator energy ( E 0), dispersion energy ( E d), optical band gap ( E g) and high frequency dielectric constant ( \\varepsilon_{∞} ). In addition, these films exhibited n-type conductivity and were highly resistive. These results confirm that In2S3 thin films are a promising alternative as a buffer-layer material for CuInGa(S,Se)2-based solar cells.

  10. Fabrication, characterization, and application in nanoenergetic materials of uncracked nano porous silicon thick films

    NASA Astrophysics Data System (ADS)

    Wang, Shouxu; Shen, Ruiqi; Yang, Cheng; Ye, Yinghua; Hu, Yan; Li, Chuangxin

    2013-01-01

    The porous silicon (PS) film has gained increasing attention in recent years as advanced nanoenergetic materials (nEMs). A simple fabrication method to prepare uncracked PS thick films was successfully realized with precisely controlled electrochemical etching, and the relationship between the current density and the concentration of electrolytes was found in its fabrication. Additionally, the capillary stresses resulted from the liquids in nanopores of PS films was another factor resulted in its crack. The nanopores composed of uncracked PS thick films distributed regularly and their diameters ranged from 2 nm to 6 nm. Its Sa (average roughness) of PS film surface was 6.53 nm, and its thickness ranged from 102.41 μm to 205.75 μm. The specific surface area was 587 m2/g and the average diameter of nanopores was 4.3 nm. The PS film was found to be monocrystal and it was same as the substrate. The crack mechanism of PS films was discussed: the porous structure reduced the strength of PS films comparing the silicon bulk and the capillary effect hastened the crack of PS films. PS films filling with sodium percholorate in nanopores were ignited by laser and the stable combustion showed that they were advantageous to be applied as micro-electromechanical systems (MEMS) compatible devices, such as silicon-based chips of mircothruster and microigniter.

  11. Thickness and microstructure effects in the optical and electrical properties of silver thin films

    NASA Astrophysics Data System (ADS)

    Ding, Guowen; Clavero, César; Schweigert, Daniel; Le, Minh

    2015-11-01

    The optical and electrical response of metal thin films approaching thicknesses in the range of the electron mean free path is highly affected by electronic scattering with the interfaces and defects. Here, we present a theoretical and experimental study on how thickness and microstructure affect the properties of Ag thin films. We are able to successfully model the electrical resistivity and IR optical response using a thickness dependent electronic scattering time. Remarkably, the product of electronic scattering time and resistivity remains constant regardless of the thickness (τx ρ = C), with a value of 59 ± 2 μΩ cm ṡ fs for Ag films in the investigated range from 3 to 74 nm. Our findings enable us to develop a theoretically framework that allows calculating the optical response of metal thin films in the IR by using their measured thickness and resistivity. An excellent agreement is found between experimental measurements and predicted values. This study also shows the theoretical lower limit for emissivity in Ag thin films according to their microstructure and thickness. Application of the model presented here will allow rapid characterization of the IR optical response of metal thin films, with important application in a broad spectrum of fundamental and industrial applications, including optical coatings, low-emissivity windows and semiconductor industry.

  12. Thickness and microstructure effects in the optical and electrical properties of silver thin films

    SciTech Connect

    Ding, Guowen Clavero, César; Schweigert, Daniel; Le, Minh

    2015-11-15

    The optical and electrical response of metal thin films approaching thicknesses in the range of the electron mean free path is highly affected by electronic scattering with the interfaces and defects. Here, we present a theoretical and experimental study on how thickness and microstructure affect the properties of Ag thin films. We are able to successfully model the electrical resistivity and IR optical response using a thickness dependent electronic scattering time. Remarkably, the product of electronic scattering time and resistivity remains constant regardless of the thickness (τx ρ = C), with a value of 59 ± 2 μΩ cm ⋅ fs for Ag films in the investigated range from 3 to 74 nm. Our findings enable us to develop a theoretically framework that allows calculating the optical response of metal thin films in the IR by using their measured thickness and resistivity. An excellent agreement is found between experimental measurements and predicted values. This study also shows the theoretical lower limit for emissivity in Ag thin films according to their microstructure and thickness. Application of the model presented here will allow rapid characterization of the IR optical response of metal thin films, with important application in a broad spectrum of fundamental and industrial applications, including optical coatings, low-emissivity windows and semiconductor industry.

  13. Temperature- and thickness-dependent elastic moduli of polymer thin films

    PubMed Central

    2011-01-01

    The mechanical properties of polymer ultrathin films are usually different from those of their counterparts in bulk. Understanding the effect of thickness on the mechanical properties of these films is crucial for their applications. However, it is a great challenge to measure their elastic modulus experimentally with in situ heating. In this study, a thermodynamic model for temperature- (T) and thickness (h)-dependent elastic moduli of polymer thin films Ef(T,h) is developed with verification by the reported experimental data on polystyrene (PS) thin films. For the PS thin films on a passivated substrate, Ef(T,h) decreases with the decreasing film thickness, when h is less than 60 nm at ambient temperature. However, the onset thickness (h*), at which thickness Ef(T,h) deviates from the bulk value, can be modulated by T. h* becomes larger at higher T because of the depression of the quenching depth, which determines the thickness of the surface layer δ. PMID:21711747

  14. The effect of Argon ion irradiation on the thickness and structure of ultrathin amorphous carbon films

    NASA Astrophysics Data System (ADS)

    Xie, J.; Komvopoulos, K.

    2016-03-01

    Carbon films synthesized by plasma-enhanced chemical vapor deposition (PECVD) and filtered cathodic vacuum arc (FCVA) exhibit a layered structure consisting of a bottom (interface) and a top (surface) layer rich in sp2 atomic carbon bonding and a middle (bulk) layer of much higher sp3 content. Because of significant differences in the composition, structure, and thickness of these layers, decreasing the film thickness may negatively affect its properties. In this study, transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS) were used to examine the effect of Ar+ ion irradiation on the structure and thickness of ultrathin films of hydrogenated amorphous carbon (a-C:H) and hydrogen-free amorphous carbon (a-C) deposited by PECVD and FCVA, respectively. The TEM and EELS results show that 2-min ion irradiation decreases the film thickness without markedly changing the film structure and composition, whereas 4-min ion irradiation results in significant film thinning and a moderate decrease of the sp3 content of the bulk layer. This study demonstrates that Ar+ ion irradiation is an effective post-deposition process for reducing the thickness and tuning the structure of ultrathin carbon films. This capability has direct implications in the synthesis of ultrathin protective carbon overcoats for extremely high-density magnetic recording applications.

  15. Planar Zeolite Film-Based Potentiometric Gas Sensors Manufactured by a Combined Thick-Film and Electroplating Technique

    PubMed Central

    Marr, Isabella; Reiß, Sebastian; Hagen, Gunter; Moos, Ralf

    2011-01-01

    Zeolites are promising materials in the field of gas sensors. In this technology-oriented paper, a planar setup for potentiometric hydrocarbon and hydrogen gas sensors using zeolites as ionic sodium conductors is presented, in which the Pt-loaded Na-ZSM-5 zeolite is applied using a thick-film technique between two interdigitated gold electrodes and one of them is selectively covered for the first time by an electroplated chromium oxide film. The influence of the sensor temperature, the type of hydrocarbons, the zeolite film thickness, and the chromium oxide film thickness is investigated. The influence of the zeolite on the sensor response is briefly discussed in the light of studies dealing with zeolites as selectivity-enhancing cover layers. PMID:22164042

  16. Hydrophobic switching nature of methylcellulose ultra-thin films: thickness and annealing effects.

    PubMed

    Innis-Samson, Vallerie Ann; Sakurai, Kenji

    2011-11-02

    We have studied the thermosensitive property of methylcellulose (MC) thin films supported on Si substrate by static sessile drop contact angle measurements, and their surface properties and thin film structure by x-ray reflectivity (XRR) and atomic force microscopy (AFM) techniques. From the static sessile drop contact angle measurements, the MC thin films showed the characteristic hydrophilic-to-hydrophobic transition at ∼70 °C, which is the lower critical solution temperature of the bulk solution volume phase separation transition. For films with thickness d ≤ R(g), the onset of such a transition is affected by the film thickness while very thick films, d ≫ R(g), yielded higher contact angles. Annealing the MC thin films with thicknesses ∼200 Å (near the radius of gyration, R(g), of the polymer) below the bulk glass transition temperature (T(g) ∼ 195 ° C) would not change the hydrophobic switch nature of the film but annealing 'at' and above the bulk T(g) would change its surface property. From surface topography images by AFM, there were no significant changes in either the roughness or the film texture before and after annealing. With XRR data, we were able to determine that such changes in the surface properties are highly correlated to the film thickness changes after the annealing process. This study, we believe, is the first to examine the thermal annealing affects on the thermal response function of a thermoresponsive polymer and is important for researching how to tailor the hydrophobic switching property of MC thin films for future sensing applications.

  17. Hydrophobic switching nature of methylcellulose ultra-thin films: thickness and annealing effects

    NASA Astrophysics Data System (ADS)

    Innis-Samson, Vallerie Ann; Sakurai, Kenji

    2011-11-01

    We have studied the thermosensitive property of methylcellulose (MC) thin films supported on Si substrate by static sessile drop contact angle measurements, and their surface properties and thin film structure by x-ray reflectivity (XRR) and atomic force microscopy (AFM) techniques. From the static sessile drop contact angle measurements, the MC thin films showed the characteristic hydrophilic-to-hydrophobic transition at ˜70 °C, which is the lower critical solution temperature of the bulk solution volume phase separation transition. For films with thickness d ≤ Rg, the onset of such a transition is affected by the film thickness while very thick films, d ≫ Rg, yielded higher contact angles. Annealing the MC thin films with thicknesses ˜200 Å (near the radius of gyration, Rg, of the polymer) below the bulk glass transition temperature (Tg ˜ 195 ° C) would not change the hydrophobic switch nature of the film but annealing ‘at’ and above the bulk Tg would change its surface property. From surface topography images by AFM, there were no significant changes in either the roughness or the film texture before and after annealing. With XRR data, we were able to determine that such changes in the surface properties are highly correlated to the film thickness changes after the annealing process. This study, we believe, is the first to examine the thermal annealing affects on the thermal response function of a thermoresponsive polymer and is important for researching how to tailor the hydrophobic switching property of MC thin films for future sensing applications.

  18. Super-resolved thickness maps of thin film phantoms and in vivo visualization of tear film lipid layer using OCT

    PubMed Central

    dos Santos, Valentin Aranha; Schmetterer, Leopold; Triggs, Graham J.; Leitgeb, Rainer A.; Gröschl, Martin; Messner, Alina; Schmidl, Doreen; Garhofer, Gerhard; Aschinger, Gerold; Werkmeister, René M.

    2016-01-01

    In optical coherence tomography (OCT), the axial resolution is directly linked to the coherence length of the employed light source. It is currently unclear if OCT allows measuring thicknesses below its axial resolution value. To investigate spectral-domain OCT imaging in the super-resolution regime, we derived a signal model and compared it with the experiment. Several island thin film samples of known refractive indices and thicknesses in the range 46 – 163 nm were fabricated and imaged. Reference thickness measurements were performed using a commercial atomic force microscope. In vivo measurements of the tear film were performed in 4 healthy subjects. Our results show that quantitative super-resolved thickness measurement can be performed using OCT. In addition, we report repeatable tear film lipid layer visualization. Our results provide a novel interpretation of the OCT axial resolution limit and open a perspective to deeper extraction of the information hidden in the coherence volume. PMID:27446696

  19. Thick, low-stress films, and coated substrates formed therefrom, and methods for making same

    DOEpatents

    Henager, Jr., Charles H.; Knoll, Robert W.

    1992-01-01

    Stress-induced deformation, and the damage resulting therefrom, increases with film thickness. The overcoming of excessive stress by the use of the Si-Al-N film material of the present invention, permits the formation of thick films that are necessary for certain of the above described applications. The most likely use for the subject film materials, other than their specialized views as an optical film, is for microelectronic packaging of components on silicon substrates. In general, the subject films have excellent adherence to the underlying substrate, a high degree of hardness and durability, and are excellent insulators. Prior art elevated temperature deposition processes cannot meet the microelectronic packaging temperature formation constraints. The process of the present invention is conducted under non-elevated temperature conditions, typically 500.degree. C. or less.

  20. Thickness dependent wetting properties and surface free energy of HfO2 thin films

    NASA Astrophysics Data System (ADS)

    Zenkin, Sergei; Belosludtsev, Alexandr; Kos, Šimon; Čerstvý, Radomír; Haviar, Stanislav; Netrvalová, Marie

    2016-06-01

    We show here that intrinsic hydrophobicity of HfO2 thin films can be easily tuned by the variation of film thickness. We used the reactive high-power impulse magnetron sputtering for preparation of high-quality HfO2 films with smooth topography and well-controlled thickness. Results show a strong dependence of wetting properties on the thickness of the film in the range of 50-250 nm due to the dominance of the electrostatic Lifshitz-van der Waals component of the surface free energy. We have found the water droplet contact angle ranging from ≈120° for the thickness of 50 nm to ≈100° for the thickness of 2300 nm. At the same time the surface free energy grows from ≈25 mJ/m2 for the thickness of 50 nm to ≈33 mJ/m2 for the thickness of 2300 nm. We propose two explanations for the observed thickness dependence of the wetting properties: influence of the non-dominant texture and/or non-monotonic size dependence of the particle surface energy.

  1. Ultrathin film organic transistors: precise control of semiconductor thickness via spin-coating.

    PubMed

    Zhang, Fengjiao; Di, Chong-an; Berdunov, Nikolai; Hu, Yuanyuan; Hu, Yunbin; Gao, Xike; Meng, Qing; Sirringhaus, Henning; Zhu, Daoben

    2013-03-13

    Construction of ultrathin film organic transistors is an important challenge towards deeper understanding of the charge transport mechanism and multifunctional applications. We report on precise thickness control of ultrathin films of several organic semiconductors by using a simple spin-coating approach. Ultrathin film, n-channel organic transistors with mobilities well over 1.0 cm(2) V(-1) s(-1) have been realized and their potential in high-sensitivity gas sensing and other applications is demonstrated.

  2. Water Storage in Thin Films Maintaining the Total Film Thickness as Probed with in situ Neutron Reflectivity.

    PubMed

    Wang, Weinan; Metwalli, Ezzeldin; Perlich, Jan; Troll, Kordelia; Papadakis, Christine M; Cubitt, Robert; Müller-Buschbaum, Peter

    2009-01-16

    We investigate a new type of thin film material which allows for water storage without an increase in film thickness, whereas typically water storage in polymers and polymer films is accompanied with a strong swelling of the film, i.e., a strong increase in the film thickness. So these films will avoid problems related to strains which are caused by swelling. The basic key for the preparation of such thin films is the installation of a glassy network by the use of an asymmetric diblock copolymer polystyrene-block-poly(N-isopropylacrylamide) [P(S-b-NIPAM)] with a long PS and short PNIPAM block in combination with a solvent which is more equal in interaction with both the blocks as compared to water. With in situ neutron reflectivity the water storage and removal are probed. The total film thickness increases only by 2.5% by allowing for a total water storage of 17.4%. Thus the material can be used for coatings to reduce humidity in nano-applications, which might suffer from changes in the water content of the surrounding environment.

  3. Physicochemical controls on absorbed water film thickness in unsaturated geological media

    SciTech Connect

    Tokunaga, T.

    2011-06-14

    Adsorbed water films commonly coat mineral surfaces in unsaturated soils and rocks, reducing flow and transport rates. Therefore, it is important to understand how adsorbed film thickness depends on matric potential, surface chemistry, and solution chemistry. Here, the problem of adsorbed water film thickness is examined through combining capillary scaling with the Derjaguin-Landau-Verwey-Overbeek (DLVO) theory. Novel aspects of this analysis include determining capillary influences on film thicknesses, and incorporating solution chemistry-dependent electrostatic potential at air-water interfaces. Capillary analysis of monodisperse packings of spherical grains provided estimated ranges of matric potentials where adsorbed films are stable, and showed that pendular rings within drained porous media retain most of the 'residual' water except under very low matric potentials. Within drained pores, capillary contributions to thinning of adsorbed films on spherical grains are shown to be small, such that DLVO calculations for flat surfaces are suitable approximations. Hamaker constants of common soil minerals were obtained to determine ranges of the dispersion component to matric potential-dependent film thickness. The pressure component associated with electrical double layer forces was estimated using the compression and linear superposition approximations. The pH-dependent electrical double layer pressure component is the dominant contribution to film thicknesses at intermediate values of matric potential, especially in lower ionic strength solutions (< 10 mol m{sup -3}) on surfaces with higher magnitude electrostatic potentials (more negative than - 50 mV). Adsorbed water films are predicted to usually range in thickness from 1 to 20 nm in drained pores and fractures of unsaturated environments.

  4. Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

    NASA Astrophysics Data System (ADS)

    Araújo, E. B.; Lima, E. C.; Bdikin, I. K.; Kholkin, A. L.

    2013-05-01

    Lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films. PZT films pyrolyzed at temperatures higher than 350 °C present a coexistence of pyrochlore and perovskite phases, while only perovskite phase grows in films pyrolyzed at temperatures lower than 300 °C. For pyrochlore-free PZT thin films, a small (100)-orientation tendency near the film-substrate interface was observed. Finally, we demonstrate the existence of a self-polarization effect in the studied PZT thin films. The increase of self-polarization with the film thickness increasing from 200 nm to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-substrate interface are not primarily responsible for the observed self-polarization effect in our films.

  5. Double Film Thickness Measurements In The Semiconductor Industry

    NASA Astrophysics Data System (ADS)

    Spanier, Richard F.

    1982-10-01

    Ellipsometry as a technique for the measurement of the optical constants (n,k,d) of two layer films on substrates is presented in a tutorial fashion. The ideal two layer film model is described and departures from ideality that are likely to be encounterd in a real sample are discussed. The ellipsometric measurement of the change in polarization state upon reflection as well as the determination of the optical reflection angles DELTA and PSI are reviewed. Extraction of the optical constants from the DELTA, PSI measurement is discussed at length. Examples are drawn from double film systems of interest to the semi-conductor industry but the principles and procedures of analysis illustrated by these examples have general application.

  6. Tuning thermoelectricity in a Bi2Se3 topological insulator via varied film thickness

    DOE PAGES

    Guo, Minghua; Wang, Zhenyu; Xu, Yong; ...

    2016-01-12

    We report thermoelectric transport studies on Bi2Se3 topological insulator thin films with varied thickness grown by molecular beam epitaxy. We find that the Seebeck coefficient and thermoelectric power factor decrease systematically with the reduction of film thickness. These experimental observations can be explained quantitatively by theoretical calculations based on realistic electronic band structure of the Bi2Se3 thin films. Lastly, this work illustrates the crucial role played by the topological surface states on the thermoelectric transport of topological insulators, and sheds new light on further improvement of their thermoelectric performance.

  7. Resistive switching in a few nanometers thick tantalum oxide film formed by a metal oxidation

    SciTech Connect

    Ohno, Takeo; Samukawa, Seiji

    2015-04-27

    Resistive switching in a Cu/Ta{sub 2}O{sub 5}/Pt structure that consisted of a few nanometer-thick Ta{sub 2}O{sub 5} film was demonstrated. The Ta{sub 2}O{sub 5} film with thicknesses of 2–5 nm was formed with a combination of Ta metal film deposition and neutral oxygen particle irradiation at room temperature. The device exhibited a bipolar resistive switching with a threshold voltage of 0.2 V and multilevel switching operation.

  8. Preparation of variable-thickness MgB 2 thin film bridges by AFM nanolithography

    NASA Astrophysics Data System (ADS)

    Gregor, M.; Plecenik, A.; Plecenik, T.; Tomasek, M.; Kus, P.; Micunek, R.; Stefecka, M.; Zahoran, M.; Grancic, B.; Kubinec, M.; Gasparik, V.

    2006-03-01

    In this paper we focus our attention on preparation of superconducting MgB2 thin films and variable-thickness MgB2 thin film bridges using the Atomic Force Microscope nanolithographic technique. Microstructures and their following variable-thickness bridges were prepared on nonsuperconducting MgB thin films. Final structures were annealed in argon atmosphere at temperature 680 °C and exhibit transition to the superconducting state Tcon = 33 K and zero critical temperature Tc0 = 30.5 K. Critical current density jc (4.2 K) measured on the bridge was higher than 106 A/cm2.

  9. Relationships between processing temperature and microstructure in isothermal melt processed Bi-2212 thick films

    SciTech Connect

    Holesinger, T.G.; Phillips, D.S.; Willis, J.O.; Peterson, D.E.

    1995-05-01

    The microstructure and phase assemblage of isothermal melt processed (IMP) Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub y} (Bi-2212) thick films have been evaluated. Results from compositional analysis and phase identification indicate that the characteristics of the partial melt greatly influence the microstructural and chemical development of the thick films. The highest critical current densities were obtained in films processed below 800{degrees}C where the partial melt uniformly coats the substrate without excessive phase segregation.

  10. Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry.

    PubMed

    Ghim, Young-Sik; Kim, Seung-Woo

    2006-11-27

    As an extension of the authors' previous report of Ref 1, we describe an improved version of dispersive white-light interferometry that enables us to measure the tomographical thickness profile of a thin-film layer through Fourier-transform analysis of spectrally-resolved interference signals. The group refractive index can also be determined without prior knowledge of the geometrical thickness of the film layer. Owing to fast measurement speed with no need of mechanical depth scanning, the proposed method is well suited for in-line 3-D inspection of dielectric thin film layers particularly for the semiconductor and flat-panel display industry.

  11. Impact of deposition-rate fluctuations on thin-film thickness and uniformity

    SciTech Connect

    Oliver, Joli B.

    2016-11-04

    Variations in deposition rate are superimposed on a thin-film–deposition model with planetary rotation to determine the impact on film thickness. Variations in magnitude and frequency of the fluctuations relative to the speed of planetary revolution lead to thickness errors and uniformity variations up to 3%. Sufficiently rapid oscillations in the deposition rate have a negligible impact, while slow oscillations are found to be problematic, leading to changes in the nominal film thickness. Finally, superimposing noise as random fluctuations in the deposition rate has a negligible impact, confirming the importance of any underlying harmonic oscillations in deposition rate or source operation.

  12. Thickness dependencies in the calculated properties of metallic ultra-thin films

    SciTech Connect

    Boettger, J.C.

    1997-12-01

    Ultra-thin film (UTF) electronic structure calculations are a common tool for investigating surface properties. For this approximation to be useful, the UTF must be thick enough that the surfaces are decoupled and the interior is bulk-like, yet thin enough that a high precision electronic structure calculation is affordable. These conditions can only be satisfied simultaneously if the properties of interest converge rapidly as the UTF thickness is increased. In this work, electronic structure calculations for Al(111) films ranging from one to twelve atoms thick are used to illustrate some of the difficulties that can arise when one attempts to determine surface properties of metals with UTF calculations.

  13. Thickness and UV irradiation effects on the gas sensing properties of Te thin films

    SciTech Connect

    Manouchehrian, M.; Larijani, M.M.; Elahi, S.M.

    2015-02-15

    Highlights: • Tellurium thin films were prepared by thermal evaporation technique. • Tellurium thin films showed excellent gas-sensing properties to H{sub 2}S at room temperature. • Tellurium showed a remarkably enhanced response to H{sub 2}S gas under UV irradiation. • The reason of the enhanced response by UV irradiation was discussed. - Abstract: In this research, tellurium thin films were investigated for use as hydrogen sulfide gas sensors. To this end, a tellurium thin film has been deposited on Al{sub 2}O{sub 3} substrates by thermal evaporation, and the influence of thickness on the sensitivity of the tellurium thin film for measuring H{sub 2}S gas is studied. XRD patterns indicate that as the thickness increases, the crystallization improves. Observing the images obtained by SEM, it is seen that the grain size increases as the thickness increases. Studying the effect of thickness on H{sub 2}S gas measurement, it became obvious that as the thickness increases, the sensitivity decreases and the response and recovery times increase. To improve the response and recovery times of the tellurium thin film for measuring H{sub 2}S gas, the influence of UV radiation while measuring H{sub 2}S gas was also investigated. The results indicate that the response and recovery times strongly decrease using UV radiation.

  14. Piezoelectric thick bismuth titanate/lead zirconate titanate composite film transducers for smart NDE of metals

    NASA Astrophysics Data System (ADS)

    Kobayashi, M.; Jen, C.-K.

    2004-08-01

    Thick film piezoelectric ceramic sensors have been successfully deposited on different metallic substrates with different shapes by a sol-gel spray technique. The ball-milled bismuth titanate fine powders were dispersed into PZT solution to achieve the gel. The films with desired thickness up to 200 µm have been obtained through the multilayer coating approach. These thick films were also effectively coated onto thin sheet metals of thickness down to 25 µm. Self-support films with flat and shell geometries were made. Piezoelectricity was achieved using the corona discharge poling method. The area of the top silver paste electrode was also optimized. The center frequencies of ultrasonic signals generated by these films ranged from 3.6 to 30 MHz and their bandwidth was broad as well. The ultrasonic signals generated and received by these ultrasonic transducers (UTs) operated in the pulse/echo mode had a signal to noise ratio more than 30 dB. The main advantages of such sensors are that they (1) do not need couplant, (2) can serve as piezoelectric and UT, (3) can be coated onto curved surfaces and (4) can operate up to 440 °C. The capability of these thick film UTs for non-destructive evaluation of materials at 440 °C has been demonstrated.

  15. Optical spectroscopy of sputtered nanometer-thick yttrium iron garnet films

    SciTech Connect

    Jakubisova-Liskova, Eva Visnovsky, Stefan; Chang, Houchen; Wu, Mingzhong

    2015-05-07

    Nanometer (nm)-thick yttrium iron garnet (Y{sub 3}Fe{sub 5}O{sub 12}, YIG) films present interest for spintronics. This work employs spectral ellipsometry and magneto-optic Kerr effect (MOKE) spectra to characterize nm-thick YIG films grown on single-crystal Gd{sub 3}Ga{sub 5}O{sub 12} substrates by magnetron sputtering. The thickness (t) of the films ranges between 10 nm and 40 nm. Independent on t, the polar MOKE hysteresis loops saturate in the field of about 1.8 kOe, consistent with the saturation magnetization in bulk YIG (4πM{sub s} ≈ 1.75 kG). The MOKE spectrum measured at photon energies between 1.3 eV and 4.5 eV on the 38-nm-thick film agrees with that measured on single-crystal YIG bulk materials. The MOKE spectrum of the 12-nm-thick film still preserves the structure of the bulk YIG but its amplitude at lower photon energies is modified due to the fact that the radiation penetration depth exceeds 20 nm. The t dependence of the MOKE amplitude is consistent with MOKE calculations. The results indicate that the films are stoichiometric, strain free, without Fe{sup 2+}, and preserve bulk YIG properties down to t ≈ 10 nm.

  16. Simultaneous sensing of film thickness and temperature using an InSb Hall element

    NASA Astrophysics Data System (ADS)

    Yuji, Jun-ichiro; Ueda, Tohru

    2016-04-01

    This paper describes a unique sensing method to apply an InSb Hall element that enables simultaneous sensing device to detect thickness of insulating film on an iron plate and temperature. We made a trial thickness-temperature sensor consists of an InSb Hall element and a small permanent magnet. Here, the film thickness is detected by the variation in distance between the Hall element with the magnet and the iron plate. The temperature characteristic of an InSb Hall element depends on the drive circuit to generate the Hall voltage. Therefore, the Hall element is driven using a constant voltage source and a constant current source by time-division to obtain two kinds of Hall output voltages. Two output Hall voltages driven by two kinds of bias circuits are measured in the film thickness range from 0 to 500 μm, and for a temperature range of -10 to 70 °C. The inverse response surfaces that are used to identify the thickness of insulating film and temperature are formulated using experimental results. The results obtained show that it is possible to detect film thickness and temperature by obtaining two kinds of Hall voltages.

  17. Thickness dependent fatigue life at microcrack nucleation for metal thin films on flexible substrates

    NASA Astrophysics Data System (ADS)

    Sun, X. J.; Wang, C. C.; Zhang, J.; Liu, G.; Zhang, G. J.; Ding, X. D.; Zhang, G. P.; Sun, J.

    2008-10-01

    For polymer-supported metal thin films used in flexible electronics, the definition of the fatigue lifetime at microcrack nucleation (FLMN) should be more physically meaningful than all the previous definitions at structural instability. In this paper, the FLMN of Cu films (with thickness from 100 nm to 3.75 µm) as well as Al thin films (from 80 to 800 nm) was experimentally characterized at different strain ranges and different thicknesses by using a simple electrical resistance measurement (ERM). A significant thickness dependence was revealed for the FLMN and a similar Coffin-Manson fatigue relationship observed commonly in bulk materials was found to be still operative in both the films. Microstructural analyses were carried out to verify the feasibility of ERM correspondingly.

  18. Lift-off PMN-PT Thick Film for High Frequency Ultrasonic Biomicroscopy.

    PubMed

    Zhu, Benpeng; Han, Jiangxue; Shi, Jing; Shung, K Krik; Wei, Q; Huang, Yuhong; Kosec, M; Zhou, Qifa

    2010-10-01

    Piezoelectric 0.65Pb(Mg(1/3)Nb(2/3))O(3)-0.35PbTiO(3) (PMN-35PT) thick film with a thickness of approximately 12 µm has been deposited on the platinum buffered Si substrate via a sol-gel composite method. The separation of the film from the substrate was achieved using a wet chemical method. The lifted-off PMN-35PT thick film exhibited good dielectric and ferroelectric properties. At 1 kHz, the dielectric constant and the dielectric loss were 3,326 and 0.037, respectively, while the remnant polarization was 30.0 µC/cm(2). A high frequency single element acoustic transducer fabricated with this film showed a bandwidth at -6 dB of 63.6% at 110 MHz.

  19. Determination of thickness, refractive index, and spectral scattering of an inhomogeneous thin film with rough interfaces

    SciTech Connect

    Pradeep, J. Anto; Agarwal, Pratima

    2010-08-15

    The magnitude of spectral transmittance and reflectance is affected by the presence of inhomogeneity and interfacial roughness. Therefore, the methods, based on the magnitude of spectral transmittance and reflectance, are not adequate for the determination of thickness and optical constants of films with inhomogeneity and interfacial roughness. The present article proposes a method for the determination of thickness and refractive index using only the positions of the interference fringes in spectral transmittance and reflectance at two different angles of incidence. The proposed method is verified through numerical simulations, which result in <1% error for the film thickness. The complete parametrical dependence of spectral transmittance and reflectance of inhomogeneous film with rough interfaces on a substrate have been worked out for the film on transparent and opaque substrates, respectively. The spectrum envelopes have been solved simultaneously and the mathematical formulae are given for the determination of spectral scattering due to inhomogeneity and interfacial roughness for both transmittance and reflectance cases.

  20. Critical thickness for stripe domain formation in FePt thin films: Dependence on residual stress

    NASA Astrophysics Data System (ADS)

    Álvarez, N. R.; Gómez, J. E.; Moya Riffo, A. E.; Vicente Álvarez, M. A.; Butera, A.

    2016-02-01

    Magnetically soft FePt thin films of varying thickness (20 nm ≤ d ≤ 100 nm) were sputter-deposited at different Ar pressures in order to systematically modify the residual stress and hence the magnetic anisotropy. The magnetic domain structure of FePt thin films showed a transition from planar to nearly parallel stripes above a critical thickness, dcr, which was found to depend on an anisotropy contribution perpendicular to the film plane, originated essentially in magnetoelastic effects. A careful structural characterization was made in order to obtain the strain and the stress induced magnetic anisotropy in the samples. Vibrating sample magnetometry and magnetic force microscopy were used to investigate the changes occurring in the magnetic domain structure and the critical thickness of each set of films. Joining together structural and magnetic results, we have been able to construct a phase diagram that divided regions of different domain structures, either by changing the film thickness or the perpendicular magnetic anisotropy. The experimental results could be satisfactorily explained by using a model developed by Murayama. The observed dependence of the magnetic properties of soft FePt thin films on the fabrication conditions opens the possibility to tune the magnetic domain configuration from planar to stripe-like domains by changing the argon sputtering pressure used during film deposition.

  1. Superconducting properties and chemical composition of NbTiN thin films with different thickness

    SciTech Connect

    Zhang, L.; Peng, W.; You, L. X.; Wang, Z.

    2015-09-21

    In this research, we systematically investigated the superconducting properties and chemical composition of NbTiN thin films prepared on single-crystal MgO substrates. The NbTiN thin films with different thicknesses (4–100 nm) were deposited by reactive DC magnetron sputtering at ambient temperature. We measured and analyzed the crystal structure and thickness dependence of the chemical composition using X-ray diffraction and X-ray photoelectron spectroscopy depth profiles. The films exhibited excellent superconducting properties, with a high superconducting critical temperature of 10.1 K, low resistivity (ρ{sub 20} = 93 μΩ cm), and residual resistivity ratio of 1.12 achieved for 4-nm-thick ultrathin NbTiN films prepared at the deposition current of 2.4 A. The stoichiometry and electrical properties of the films varied gradually between the initial and upper layers. A minimum ρ{sub 20} of 78 μΩ cm and a maximum residual resistivity ratio of 1.15 were observed for 12-nm-thick films, which significantly differ from the properties of NbN films with the same NaCl structure.

  2. Fabrication and Characterization of PZT Thick Films for Sensing and Actuation

    PubMed Central

    Jang, Ling-Sheng; Kuo, Kuo-Ching

    2007-01-01

    Lead Zirconate Titanate oxide (PZT) thick films with thicknesses of up to 10 mm were developed using a modified sol-gel technique. Usually, the film thickness is less than 1 mm by conventional sol-gel processing, while the electrical charge accumulation which reveals the direct effect of piezoelectricity is proportional to the film thickness and therefore restricted. Two approaches were adopted to conventional sol-gel processing – precursor concentration modulation and rapid thermal annealing. A 10 μm thick film was successfully fabricated by coating 16 times via this technique. The thickness of each coating layer was about 0.6 mm and the morphology of the film was dense with a crack-free area as large as 16 mm2. In addition, the structure, surface morphology and physical properties were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM) and electrical performance. The dielectric constant and hysteresis loops were measured as electric characteristics. This study investigates the actuation and sensing performance of the vibrating structures with the piezoelectric thick film. The actuation tests demonstrated that a 4 mm × 4 mm × 6.5 mm PZT film drove a 40 mm × 7 mm × 0.5 mm silicon beam as an actuator. Additionally, it generated an electrical signal of 60 mVpp as a sensor, while vibration was input by a shaker. The frequencies of the first two modes of the beam were compared with the theoretical values obtained by Euler-Bernoulli beam theory. The linearity of the actuation and sensing tests were also examined.

  3. Surface and thickness measurement of a transparent film using wavelength scanning interferometry.

    PubMed

    Gao, Feng; Muhamedsalih, Hussam; Jiang, Xiangqian

    2012-09-10

    A wavelength scanning interferometer for measuring the surface and thickness of a transparent film has been studied. A halogen light source combined with an acousto-optic tuneable filter is used to generate a sequence of filtered light in a Linnik interferometer, which leads to a sequence of interferograms captured by a CCD camera. When a transparent thin film is measured, the reflection signals from both the top and bottom surfaces of the film will interfere with the reference signal. At the same time, the multiple reflection signals between the two film surfaces will also interfere with each other. Effective separation of the interference signals from each other is the key to achieving a successful measurement. By performing a frequency-domain analysis, these interference signals can be separated. An optimized Fourier transform method is used in the analysis. Measurements of the top and bottom surface finishes of the film, as well as the film thickness map, have been achieved. The film needs to be more than 3 µm in optical path length, and must transparent with no absorption of light. The film's refractive index needs to be known as a function of wavelength. In this paper, the theoretical analysis and simulation study of wavelength scanning interferometry for transparent film measurement is discussed. Experiments on thin film layers of Parylene N coated on a glass slide surface are studied and analyzed. Comparison study results with other contact and non-contact methods are also presented.

  4. Thickness dependence of transport properties of doped polycrystalline tin oxide films

    SciTech Connect

    Belanger, D.; Dickson, J.I.; Dodelet, J.P.; Lombos, B.A.

    1985-06-01

    Tin oxide films were deposited by chemical vapor deposition on borosilicate and fused silica substrates using dibutyltin diacetate (DBTD) as tin feedstock and SbC/sub 5/ or CC/sub 3/-CF/sub 3/ as dopants. The film growth rate was measured as a function of dopant/DBTD ratio, temperature, and film thickness. Scanning electron microscopy and x-ray diffraction spectra of the films were used to determine the grain sizes and the preferential orientations of the crystallites in the film as a function of film thickness. Optical and electrical properties were measured. A model is proposed to elucidate the variation of transport properties of doped SnO/sub 2/ as a function of film thickness. It could b shown with this model that the thickness dependence of the conductivity of doped SnO/sub 2/:Sb and SnO/sub 2/:F films could be analyzed in terms of carrier concentration taking into consideration deep-level compensation. The number of carriers is decreased by electron trapping at Sb(III) or Sn(II) surface states when antimony or fluorine are used as dopant, respectively. The model based on results of the literature related to a single crystal with (110) orientation is extended in this work to other crystallite orientations. The present analysis indicates that deep levels appear only on the grain boundary surfaces with (110), (211), and (301) orientations, and not on the (200) and (400) ones. The concentration of free carriers can be calculated on the basis of x-ray diffraction spectra indicating an estimate of the relative fraction of the crystallites with each orientation as a function of the film thickness. The conductivities of the films can be computed using this model and taking a single value for the electron mobility of 19 cm/sup 2/ (V-s)/sup -1/ for all film thickness and a total donor concentration of 2 x 10/sup 20/ cm/sup -3/. All the obtained experimental data can be accounted for exclusively on the basis of film-thickness dependent carrier concentration.

  5. Thickness and energy dependence of secondary ion emissions from Langmuir Blodgett films

    NASA Astrophysics Data System (ADS)

    Hoshi, T.; Yoshida, S.; Watanabe, T.; Ichinohe, Y.; Kudo, M.

    1999-04-01

    Using Cd arachidate films formed on Ag and Si substrates, secondary ion intensities were investigated by TOF-SIMS. The intensities of [M+H] +, [M+Cd] + and Ag cationized ions from samples on the Ag and Si substrates were found to change as a function of LB film thickness, as well as the primary beam energy. The intensities of [M+H] + and [M+Cd] + were seen to be (1) the highest at a one-layer LB film, (2) to decrease as the LB film becomes thicker, (3) change slightly with the primary ion beam energy. On the other hand, the intensities of Ag cationized secondary ions were almost constant with the changes of LB thickness and the energy of the primary ion beam, after normalized by Ag + intensity. The results were discussed in terms of the energy transfer of the primary beam to the LB films, the property of the substrate materials, and the strength of chemical bondings.

  6. Improved gas sensing and dielectric properties of Fe doped hydroxyapatite thick films: Effect of molar concentrations

    SciTech Connect

    Mene, Ravindra U.; Mahabole, Megha P.; Mohite, K.C.; Khairnar, Rajendra S.

    2014-02-01

    Highlights: • We report improved gas sensing and dielectric characteristics of Fe ion exchanged HAp films. • Fe doped HAp film shows maximum gas response at relatively lower temperature. • Response and gas uptake capacity of sensors is improved for appropriate amount of Fe ions in HAp matrix. • Fe-HAp films exhibit remarkable improvement in dielectric properties compared to pure HAp. • Fe doped HAp films show significant improvement in gas sensing as well as in dielectric properties. - Abstract: In the present work Fe doped hydroxyapatite (Fe-HAp) thick films has been successfully utilized to improve the gas sensing as well as its dielectric properties. Initially, HAp nano powder is synthesized by chemical precipitation process and later on Fe ions are doped in HAp by ion exchange process. Structural and morphological modifications are observed by means of X-ray diffraction and scanning electron microscopy analysis. The sensing parameters such as operating temperature, response/recovery time and gas uptake capacity are experimentally determined. The Fe-HAp (0.05 M) film shows improved CO and CO{sub 2} gas sensing capacity at lower operating temperature compared to pure HAp. Moreover, variation of dielectric constant and dielectric loss for pure and Fe-HAp thick films are studied as a function of frequency in the range of 10 Hz–1 MHz. The study reveals that Fe doped HAp thick films improve the sensing and dielectric characteristics as compared to pure HAp.

  7. Thickness dependence of giant magnetoresistance effect in granular Cu-Co thin films

    NASA Astrophysics Data System (ADS)

    Małkiński, L. M.; Wang, J.-Q.; Seip, C. T.; Wiemann, J.; Wiley, J. B.

    1999-04-01

    This work investigates the magnetic and transport properties of Cu-Co thin films with a special reference to their dependence on the film thickness. Such dependencies of the giant magnetoresistance (GMR) effect in silver-based magnetic alloys, such as Ag-Fe, Ag-Co, and Ag-FeNi films, have recently been found, and they were interpreted within the framework of surface spin-flipping scattering. This article reports on similar thickness dependence in the Cu-based alloy, although the spin-orbit interaction in Cu films is much weaker than in Ag films. A reduction of the GMR in the thinnest samples by a factor of 6, compared to the value of as-deposited bulk samples (8.6% in 50 kOe and at 5 K), was accompanied by an increase in resistivity by no more than 50%. A novel vapor-mixing technique of simultaneous sputtering from two sources was used to deposit Cu80Co20 granular thin films of the 20% nominal Co volume fraction. The thickness of the films, ranging from 8 to 400 nm, was measured by the small-angle x-ray reflectivity method. The average size of the Co particles ranging from 2.5 to 3 nm was determined from the superparamagnetic behavior of the Cu-Co granular films.

  8. Impact of thickness on microscopic and macroscopic properties of Fe-Te-Se superconductor thin films

    NASA Astrophysics Data System (ADS)

    Zhang, N.; Wang, J. O.; Lei, T.; Liu, C.; Zhang, S. H.; Qian, H. J.; Wu, R.; Zhou, H.; Wang, H. Q.; Zheng, J. C.; Guo, H. Z.; Yan, L.; Ibrahim, K.

    2015-04-01

    A series of iron based Fe-Te-Se superconductor thin films depositing on 0.7wt% Nb-doped SrTiO3 at substrate temperatures in the 250°C -450°C range by pulsed laser ablation of a constituents well defined precursor FeTe0.55Se0.55 target sample. We study the possible growth mechanism and its influence on the superconductor properties. Experimental results indicate the superconductive and non-superconductive properties are modulated only by the thickness of the thin films through the temperature range. The films appear as superconductor whenever the thickness is above a critical value ˜30nm and comes to be non-superconductor below this value. Relative ratios of Fe to (Te+Se) in the films retained Fe/(Te+Se)<1 for superconductor and Fe/(Te+Se)>1 for non-superconductor no matter what the film growth temperature was. The effect of film growth temperature takes only the role of modulating the ratio of Te/Se and improving crystallinity of the systems. According to the experimental results we propose a sandglass film growth mechanism in which the interfacial effect evokes to form a Fe rich area at the interface and Se or Te starts off a consecutive filling up process of chalcogenide elements defect sides, the process is significant before the film thickness reaches at ˜30nm.

  9. Thin casein films as prepared by spin-coating: influence of film thickness and of pH.

    PubMed

    Müller-Buschbaum, P; Gebhardt, R; Maurer, E; Bauer, E; Gehrke, R; Doster, W

    2006-06-01

    Casein films were successfully prepared with the spin-coating technique of aqueous casein solutions on base-treated glass surfaces. The film structure is investigated in real space with optical microscopy and atomic force microscopy and for the first time in reciprocal space with grazing incidence small-angle X-ray scattering (GISAXS). The size of the substructures detected in the film increases with pH from 170 nm (pH 5.1) up to 490 nm (pH 9.4). Dynamic light scattering experiments reveal that the average diameters of casein micelles in solution exhibit the same quantitative increase. This result suggests that the substructures detected in the bulklike films with GISAXS reflect intact casein micelles. However, with thin homogeneous casein films, the micelle size diminishes with decreasing film thickness. This indicates that the moderate pressures introduced by spin-coating force the micelles to rearrange into a more compact structure.

  10. Magnetic phases of fcc Fe films in the 5{endash}11 monolayer thickness range

    SciTech Connect

    Escorcia-Aparicio, E.J.; Choi, H.J.; Kawakami, R.K.; Qiu, Z.Q.

    1998-07-01

    Using the methods of artificial roughening and interfacial doping, we investigated the effects of film roughness and interdiffusion on the formation of the magnetic phase of the fcc Fe film in the Fe/Co/Cu(100) system. We found that it is the degree of film roughness that determines the magnetic phase of the fcc Fe film in the 5{endash}11 monolayer thickness range, and that the interdiffusion plays no appreciable role in the formation of the magnetic phase. {copyright} {ital 1998} {ital The American Physical Society}

  11. A 200 nm thick glass-forming metallic film for fatigue-property enhancements

    NASA Astrophysics Data System (ADS)

    Chiang, C. L.; Chu, J. P.; Liu, F. X.; Liaw, P. K.; Buchanan, R. A.

    2006-03-01

    In this letter, we report the fatigue-property enhancement by a thin layer of glass-forming film. The fatigue life of a 316L stainless steel is considerably improved by at least 30 times, depending on the maximum applied stress when it is coated with a 200nm thick Zr47Cu31Al13Ni9 film. The application of the sputtered film yields an increase of the fatigue limit by 30%. The smooth surface, good adhesion, and compressive residual stress are found to play beneficial roles in achieving superior fatigue properties, revealing the glass-forming film as a potential material to enhance fatigue properties.

  12. Unusual Contact-Line Dynamics of Thick Films and Drops

    NASA Technical Reports Server (NTRS)

    Veretennikov, Igor; Agarwal, Abhishek; Indeikina, Alexandra; Chang, Hsueh-Chia

    1999-01-01

    We report several novel phenomena In contact-line and fingering dynamics of macroscopic spinning drops and gravity-driven films with dimensions larger than the capillary length. It is shown through experimental and theoretical analysis that such macroscopic films can exhibit various interfacial shapes, including multi valued ones, near the contact line due to a balance between the external body forces with capillarity. This rich variety of front shapes couples with the usual capillary, viscous, and intermolecular forces at the contact line to produce a rich and unexpected spectrum of contact-line dynamics. A single finger develops when part of the front becomes multivalued on a partially wetting macroscopic spinning drop in contrast to a different mechanism for microscopic drops of completely wetting fluids. Contrary to general expectation, we observe that, at high viscosity and low frequencies of rotation, the speed of a glycerine finger increases with increasing viscosity. Completely wetting Dow Corning 200 Fluid spreads faster over a dry inclined plane than a prewetted one. The presence of a thin prewetted film suppresses fingering both for gravity-driven flow and for spin coating. We analyze some of these unique phenomena in detail and offer qualitative physical explanations for the others.

  13. Enhanced film thickness for Néel wall in soft magnetic film by introducing strong magnetocrystalline anisotropy

    PubMed Central

    Xu, Fei; Wang, Tao; Ma, Tianyong; Wang, Ying; Zhu, Shimeng; Li, Fashen

    2016-01-01

    This study investigated the magnetic domain walls in a single-layer soft magnetic film with strong magnetocrystalline anisotropy energy. The soft magnetic film is composed of a highly c-axis-oriented hcp-Co81Ir19 alloy with strong negative magnetocrystalline anisotropy. The domain structure of the soft Co81Ir19 films with thickness ranging from 50–230 nm in a demagnetization state was observed through magnetic force microscopy and Lorentz transmission electron microscopy. Results reveal that the critical transition thickness at which the domain wall changes from Néel type to Bloch type is about 138 nm, which is much larger than the critical value of traditional Fe- and Co-based soft magnetic films with negligible magnetocrystalline anisotropy. Theoretical calculation was also performed and the calculated result agrees well with experimental data. PMID:26821614

  14. Enhanced film thickness for Néel wall in soft magnetic film by introducing strong magnetocrystalline anisotropy.

    PubMed

    Xu, Fei; Wang, Tao; Ma, Tianyong; Wang, Ying; Zhu, Shimeng; Li, Fashen

    2016-01-29

    This study investigated the magnetic domain walls in a single-layer soft magnetic film with strong magnetocrystalline anisotropy energy. The soft magnetic film is composed of a highly c-axis-oriented hcp-Co81Ir19 alloy with strong negative magnetocrystalline anisotropy. The domain structure of the soft Co81Ir19 films with thickness ranging from 50-230 nm in a demagnetization state was observed through magnetic force microscopy and Lorentz transmission electron microscopy. Results reveal that the critical transition thickness at which the domain wall changes from Néel type to Bloch type is about 138 nm, which is much larger than the critical value of traditional Fe- and Co-based soft magnetic films with negligible magnetocrystalline anisotropy. Theoretical calculation was also performed and the calculated result agrees well with experimental data.

  15. Enhanced film thickness for Néel wall in soft magnetic film by introducing strong magnetocrystalline anisotropy

    NASA Astrophysics Data System (ADS)

    Xu, Fei; Wang, Tao; Ma, Tianyong; Wang, Ying; Zhu, Shimeng; Li, Fashen

    2016-01-01

    This study investigated the magnetic domain walls in a single-layer soft magnetic film with strong magnetocrystalline anisotropy energy. The soft magnetic film is composed of a highly c-axis-oriented hcp-Co81Ir19 alloy with strong negative magnetocrystalline anisotropy. The domain structure of the soft Co81Ir19 films with thickness ranging from 50-230 nm in a demagnetization state was observed through magnetic force microscopy and Lorentz transmission electron microscopy. Results reveal that the critical transition thickness at which the domain wall changes from Néel type to Bloch type is about 138 nm, which is much larger than the critical value of traditional Fe- and Co-based soft magnetic films with negligible magnetocrystalline anisotropy. Theoretical calculation was also performed and the calculated result agrees well with experimental data.

  16. Critical thickness for ferromagnetism in insulating LaMnO3 films

    NASA Astrophysics Data System (ADS)

    Renshaw Wang, X.; Poccia, N.; Leusink, D. P.; Paudel, Tura R.; Tsymbal, E. Y.; Li, C. J.; Lv, W. M.; Venkatesan, T.; Ariando, Ariando; Hilgenkamp, H.

    2014-03-01

    The interplay between exchange interactions, interfacial charges, and confinement effects controls the electronic, magnetic, and transport properties of complex oxide thin films. Here we report the emergence of ferromagnetism in insulating LaMnO3 thin films grown on SrTiO3 substrates beyond a critical thickness. LaMnO3 (001) films are deposited by a pulsed laser deposition technique with thicknesses varying from 1 unit cell to 24 unit cells. The position dependent local magnetization is then mapped with micrometer resolution using scanning superconducting quantum interference device microscopy. We find that the magnetic ground state switches from non-ferromagnetic to ferromagnetic within a change of one unit cell above the critical thickness of 5 unit cells with characteristic domain size of about 20 μm. Further increase of film thickness up to 24 unit cells leads to reduction of the domain size to about 10 μm. The critical thickness is qualitatively explained in terms of the charge transfer in polar LaMnO3 (001) thin films based on results of additional experimental data, density-functional calculations, and the electrostatic modeling.

  17. Thermal Conductivity Measurement of Xe-Implanted Uranium Dioxide Thick Films using Multilayer Laser Flash Analysis

    SciTech Connect

    Nelson, Andrew T.

    2012-08-30

    The Fuel Cycle Research and Development program's Advanced Fuels campaign is currently pursuing use of ion beam assisted deposition to produce uranium dioxide thick films containing xenon in various morphologies. To date, this technique has provided materials of interest for validation of predictive fuel performance codes and to provide insight into the behavior of xenon and other fission gasses under extreme conditions. In addition to the structural data provided by such thick films, it may be possible to couple these materials with multilayer laser flash analysis in order to measure the impact of xenon on thermal transport in uranium dioxide. A number of substrate materials (single crystal silicon carbide, molybdenum, and quartz) containing uranium dioxide films ranging from one to eight microns in thickness were evaluated using multilayer laser flash analysis in order to provide recommendations on the most promising substrates and geometries for further investigation. In general, the uranium dioxide films grown to date using ion beam assisted deposition were all found too thin for accurate measurement. Of the substrates tested, molybdenum performed the best and looks to be the best candidate for further development. Results obtained within this study suggest that the technique does possess the necessary resolution for measurement of uranium dioxide thick films, provided the films are grown in excess of fifty microns. This requirement is congruent with the material needs when viewed from a fundamental standpoint, as this length scale of material is required to adequately sample grain boundaries and possible second phases present in ceramic nuclear fuel.

  18. Effect of film thickness on the antifouling performance of poly(hydroxy-functional methacrylates) grafted surfaces.

    PubMed

    Zhao, Chao; Li, Lingyan; Wang, Qiuming; Yu, Qiuming; Zheng, Jie

    2011-04-19

    The development of nonfouling biomaterials to prevent nonspecific protein adsorption and cell/bacterial adhesion is critical for many biomedical applications, such as antithrombogenic implants and biosensors. In this work, we polymerize two types of hydroxy-functional methacrylates monomers of 2-hydroxyethyl methacrylate (HEMA) and hydroxypropyl methacrylate (HPMA) into polymer brushes on the gold substrate via surface-initiated atom transfer radical polymerization (SI-ATRP). We systematically examine the effect of the film thickness of polyHEMA and polyHPMA brushes on their antifouling performance in a wide range of biological media including single-protein solution, both diluted and undiluted human blood serum and plasma, and bacteria culture. Surface plasmon resonance (SPR) results show a strong correlation between antifouling property and film thickness. Too thin or too thick polymer brushes lead to large protein adsorption. Surfaces with the appropriate film thickness of ∼25-45 nm for polyHPMA and ∼20-45 nm for polyHEMA can achieve almost zero protein adsorption (<0.3 ng/cm(2)) from single-protein solution and diluted human blood plasma and serum. For undiluted human blood serum and plasma, polyHEMA brushes at a film thickness of ∼20-30 nm adsorb only ∼3.0 and ∼3.5 ng/cm(2) proteins, respectively, while polyHPMA brushes at a film thickness of ∼30 nm adsorb more proteins of ∼13.5 and ∼50.0 ng/cm(2), respectively. Moreover, both polyHEMA and polyHPMA brushes with optimal film thickness exhibit very low bacteria adhesion. The excellent antifouling ability and long-term stability of polyHEMA and polyHPMA brushes make them, especially for polyHEMA, effective and stable antifouling materials for usage in blood-contacting devices.

  19. Thickness Dependence of Electrical and Structural Properties of Tensile Strained Calcium Manganese Oxide Thin Films

    NASA Astrophysics Data System (ADS)

    Hart, Cacie; Warecki, Zoey; Chaudhry, Adeel; Ferrone, Natalie; Houston, David; Lawson, Bridget; Yong, Grace; Kolagani, Rajeswari

    We have investigated the properties of CaMnO3-δ thin films epitaxially grown by pulsed laser deposition on lattice mismatched substrates, (100)LaAlO3 and (100)SrTiO3 , leading to a tensile strain of ~4 % and 1.5 % respectively. For our films these substrates, thickness dependence of the properties is characteristically different from what has been previously observed in thin films of hole-doped manganites. We observe that the resistivity decreases significantly as the film thickness decreases. The decrease in resistivity is more pronounced in the films on (100)SrTiO3 with the larger lattice mismatch, the resistivity of the thinnest films being about 3 orders of magnitude lower than the of bulk CaMnO3. Thickness dependence of the lattice constants also show deviations from the behavior expected from strain relaxation. These results suggest a coupling between tensile strain and oxygen deficiency consistent with predictions from models based on density functional theory calculations. Our results are relevant for potential catalytic applications of CaMnO3-δ thin films. NSF Grant ECCS112856 and Seed Funding from the School of Emerging Technologies.

  20. Terahertz ultrathin film thickness sensor below λ/90 based on metamaterial.

    PubMed

    Chen, Meng; Fan, Fei; Shen, Si; Wang, Xianghui; Chang, Shengjiang

    2016-08-10

    The film thickness sensing based on metamaterial is investigated in the terahertz (THz) region. We fabricated the metamaterial sensor, and demonstrated its resonance by using the THz time-domain spectroscopy system. The results show that the resonant dip redshifts as the film thickness increases, which achieves reliable film sensing in the THz band. Its sensitivity is larger than 9.4 GHz/μm with a film thinner than λ/90. Meanwhile, the sensing mechanism is revealed by the simulation of near-field resonance distribution, which shows that the resonant intensity is stronger when the field is closer to the interface between the metamaterial surface and polyvinyl alcohol film. Therefore, the nonlinear type of the sensing sensitivity in our experiment can be well explained, and a higher sensitive sensing can be obtained when the film thickness is smaller. This simple and flexible method can realize the ultrathin film sensing in the THz region, and has application potential in the real-time monitoring of sample quality.

  1. Yttrium Iron Garnet Thick Films Formed by the Aerosol Deposition Method for Microwave Inductors

    NASA Astrophysics Data System (ADS)

    Johnson, Scooter; Newman, Harvey; Glaser, E. R.; Cheng, Shu-Fan; Tadjer, Marko; Kub, Fritz; Eddy, Charles, Jr.

    2014-03-01

    We have employed the aerosol deposition method (ADM) to direct-write 40 μm-thick polycrystalline films of yttrium iron garnet (YIG, Y3Fe5O12) at room temperature onto patterned gold inductors on sapphire substrates at a deposition rate of 1-3 μm/min as a first step toward integration into microwave magnetic circuits. A challenge to integrating magnetic films into current semiconductor technology is the high-temperature regime (900-1400°C) at which conventional ferrite preparation takes place. The ability of the ADM to form dense, thick films at room temperature makes this a promising approach for integrated magnetics where low-temperature deposition and thick films are required. The ADM YIG film has an rms roughness of 3-4 μm, is comprised of nano-crystalline grains with a density 50% of the theoretical value. XRD patterns of the as-deposited film and starting powder indicate a polycrystalline single-phase film. In-plane VSM and FMR measurements reveal a saturation of 22 emu/g, coercivity of 27 Oe, and linewidth of 360 Oe. Early measurements of air-filled and YIG-filled gold inductors between 0.01-10 GHz indicate an improved inductance of nearly a factor of 2 at low frequency. At higher frequency, resonance effects diminish this improvement. This work is sponsored by the Office of Naval Research under program number N0001413WX20845 (Dr. Daniel Green, Program Manager).

  2. Layer-by-layer Assembly of Thick, Cu2+-Chelating Films

    PubMed Central

    Wijeratne, Salinda; Bruening, Merlin L.; Baker, Gregory L.

    2013-01-01

    Layer-by-layer adsorption of protonated poly(allylamine) (PAH) and deprotonated poly(N,N-dicarboxymethylallyl amine) (PDCMAA) yields thick films with a high density of iminodiacetic acid (IDA) ligands that bind metal ions. When film deposition occurs at pH 3.0, PAH/PDCMAA bilayer thicknesses reach 200 nm, and Cu2+ binding capacities are ~2.5 mmoles per cm3 of film. (PAH/PDCMAA)10 films deposited at pH 3.0 are 4- to 8-fold thicker than films formed at pH 5.0, 7.0, or 9.0, presumably because of the low charge density on PDCMAA chains at pH 3.0. However, with normalization to film thickness, all films bind similar amounts of Cu2+ from pH 4.1 solutions of CuSO4. In μm-thick films, equilibration of binding sites with Cu2+ requires ~4 h due to a low Cu2+ diffusion coefficient (~2.6×10−12 cm2/sec). Sorption isotherms determined at several temperatures show that Cu2+ binding is endothermic with a positive entropy (binding constants increase with increasing temperature), presumably because metal-ion complexation involves displacement of both a proton from IDA and water molecules from Cu2+. (PAH/PDCMAA)10 films retain their binding capacity over 4 absorption/elution cycles and may prove useful in metal-ion scavenging, catalysis, and protein binding. PMID:24044576

  3. Temperature effect on the mechanical properties of gold nano films with different thickness

    NASA Astrophysics Data System (ADS)

    Birleanu, C.; Pustan, M.; Merie, V.; Müller, R.; Voicu, R.; Baracu, A.; Craciun, S.

    2016-08-01

    The microelectronic industry has been growing rapidly over the past 10-20 years, as has its reliance on thin-film deposition techniques for components manufacturing. As modern devices generate quite a bit of heat and peak temperatures can reach over 100°C, there is a need to provide adequate cooling for a device to stay operable. A series of chrome gold films with various thicknesses were prepared on silicon substrate. The structural and surface morphology, adhesion, friction, Young's modulus and hardness of this thin film were studied for three different thicknesses under temperature variations between 20 to 100°C. The variation of the film thickness and temperature affects the structure, surface and mechanical properties of Cr/Au thin films. Obviously these thermal cycles are unavoidable and eventually lead to thermal fatigue damage and device failure. Consequently, the knowledge of mechanical properties of thin films at elevated temperatures is required for proper chip design and reliability assessments. Elastic modulus and hardness are two important mechanical properties of the thin-film structural materials used in microelectromechanical systems. The mechanical properties of electroplated chrome-gold thin film are found to be highly dependent on the manufacturing process and also of the thin film thickness. On the other hand it is important to find the effect of temperature on these properties. Investigated samples are made of thin layers of chromium and gold with differences in thickness. The three levels of nominal thicknesses of Au films are: 100, 300 and 500 nm. In order to obtain the relations between surface pattern/surface chemistry and nanotribological properties and adhesive behaviors of the films were evaluated with a noise- and vibration-isolated and environment-controlled XE 70-AFM from Park Systems, using the contact mode. The tests were performed at temperatures between 10°C - 100°C and at a relative humidity RH of 40%. Each measurement was

  4. (100)-Textured KNN-based thick film with enhanced piezoelectric property for intravascular ultrasound imaging

    PubMed Central

    Zhu, Benpeng; Zhang, Zhiqiang; Ma, Teng; Yang, Xiaofei; Li, Yongxiang; Shung, K. Kirk; Zhou, Qifa

    2015-01-01

    Using tape-casting technology, 35 μm free-standing (100)-textured Li doped KNN (KNLN) thick film was prepared by employing NaNbO3 (NN) as template. It exhibited similar piezoelectric behavior to lead containing materials: a longitudinal piezoelectric coefficient (d33) of ∼150 pm/V and an electromechanical coupling coefficient (kt) of 0.44. Based on this thick film, a 52 MHz side-looking miniature transducer with a bandwidth of 61.5% at −6 dB was built for Intravascular ultrasound (IVUS) imaging. In comparison with 40 MHz PMN-PT single crystal transducer, the rabbit aorta image had better resolution and higher noise-to-signal ratio, indicating that lead-free (100)-textured KNLN thick film may be suitable for IVUS (>50 MHz) imaging. PMID:25991874

  5. (100)-Textured KNN-based thick film with enhanced piezoelectric property for intravascular ultrasound imaging

    NASA Astrophysics Data System (ADS)

    Zhu, Benpeng; Zhang, Zhiqiang; Ma, Teng; Yang, Xiaofei; Li, Yongxiang; Shung, K. Kirk; Zhou, Qifa

    2015-04-01

    Using tape-casting technology, 35 μm free-standing (100)-textured Li doped KNN (KNLN) thick film was prepared by employing NaNbO3 (NN) as template. It exhibited similar piezoelectric behavior to lead containing materials: a longitudinal piezoelectric coefficient (d33) of ˜150 pm/V and an electromechanical coupling coefficient (kt) of 0.44. Based on this thick film, a 52 MHz side-looking miniature transducer with a bandwidth of 61.5% at -6 dB was built for Intravascular ultrasound (IVUS) imaging. In comparison with 40 MHz PMN-PT single crystal transducer, the rabbit aorta image had better resolution and higher noise-to-signal ratio, indicating that lead-free (100)-textured KNLN thick film may be suitable for IVUS (>50 MHz) imaging.

  6. Micro-Machined High-Frequency (80 MHz) PZT Thick Film Linear Arrays

    PubMed Central

    Zhou, Qifa; Wu, Dawei; Liu, Changgeng; Zhu, Benpeng; Djuth, Frank; Shung, K. Kirk

    2010-01-01

    This paper presents the development of a micro-machined high-frequency linear array using PZT piezoelectric thick films. The linear array has 32 elements with an element width of 24 μm and an element length of 4 mm. Array elements were fabricated by deep reactive ion etching of PZT thick films, which were prepared from spin-coating of PZT solgel composite. Detailed fabrication processes, especially PZT thick film etching conditions and a novel transferring-and-etching method, are presented and discussed. Array designs were evaluated by simulation. Experimental measurements show that the array had a center frequency of 80 MHz and a fractional bandwidth (−6 dB) of 60%. An insertion loss of −41 dB and adjacent element crosstalk of −21 dB were found at the center frequency. PMID:20889407

  7. Thickness dependent optical and electrical properties of CdSe thin films

    NASA Astrophysics Data System (ADS)

    Purohit, A.; Chander, S.; Nehra, S. P.; Lal, C.; Dhaka, M. S.

    2016-05-01

    The effect of thickness on the optical and electrical properties of CdSe thin films is investigated in this paper. The films of thickness 445 nm, 631 nm and 810 nm were deposited on glass and ITO coated glass substrates using thermal evaporation technique. The deposited thin films were thermally annealed in air atmosphere at temperature 100°C and were subjected to UV-Vis spectrophotometer and source meter for optical and electrical analysis respectively. The absorption coefficient is observed to increase with photon energy and found maximum in higher photon energy region. The extinction coefficient and refractive index are also calculated. The electrical analysis shows that the electrical resistivity is observed to be decreased with thickness.

  8. Analysis of thickness dependent on crystallization kinetics in thin isotactic-polysterene films

    NASA Astrophysics Data System (ADS)

    Khairuddin

    2016-11-01

    Crystalliaztion kinetics of thin film of Isotactic Polysterene (it-PS) films has been studied. Thin PET films having thickness of 338, 533, 712, 1096, 1473, and 2185 A° were prepared by using spin-cast technique. The it-PS crystals were grown on Linkam-hostage in the temperature range 130-240°C with an interval of 10°C. The crystal growths are measured by optical microscopy in lateral direction. It was found that a substantial thickness dependence on crystallisation rate. The analysis using fitting technique based on theory crystal growth of Lauritzen-Hoffman showed that the fitting technique could not resolve to predict the mechanism controlling the thickness dependence on the rate of crystallisation. The possible reasons were due to the crystallisation rate varies with the type of crystals (smooth, rough, overgrowth terrace), and the crystallisation rate changes with the time of crystallisation.

  9. Simulation for effect of process parameters on surface profile in thick film photolithography

    NASA Astrophysics Data System (ADS)

    Tang, Xionggui; Li, Heping; Liao, Jingkun; Liu, Yongzhi; Guo, Yongkang

    2007-12-01

    The microstructure with high fidelity is very important while being used as micro-optical component, because the performance tightly depends on the profile quality of microstructure. Optical lithography method based on thick film resist plays an increasing important role in fabrication for microstructure. However, the profile quality of the microstructure is greatly affected by process parameters adopted in the experiment. In this paper, the effect of illumination wavelength, gap distance and absorption coefficient on the profile quality after development has been simulated, analyzed and discussed in detail, by using the model for thick film lithography. The simulated results show that these process parameters have a great impact on the profile quality of microstructures, which it is helpful for process optimization and profile control of thick film photolithography.

  10. Measurement of the Temperature Coefficient of Resistance in Metallic Films with Nano-thickness

    NASA Astrophysics Data System (ADS)

    Oliva, A. I.; Lugo, J. M.

    2016-03-01

    The temperature coefficient of resistance (TCR) values of gold and aluminum films deposited on glass substrates were obtained in the range of thickness from 20 nm to 200 nm at 298 K and atmospheric pressure conditions. Applying an electrical current and measuring simultaneously the corresponding changes of voltage (i.e., electrical resistance), and the change of temperature on the thin films, the TCR value was estimated. The measured TCR values show a decrement with the film thickness reduction, and their values are approximately 13.0 % lower than their corresponding bulk values mainly for thinner films. A comparison with previously reported cooper TCR values and the values estimated with the Tellier-Tosser model show good agreement with differences of about 5.0 % between them.

  11. Realization of hexagonal barium ferrite thick films on Si substrates using a screen printing technique

    NASA Astrophysics Data System (ADS)

    Chen, Yajie; Smith, Ian; Geiler, Anton L.; Vittoria, Carmine; Zagorodnii, Volodymyr; Celinski, Zbigniew; Harris, Vincent G.

    2008-05-01

    Hexagonal barium ferrite thick films (50-200 µm) have been deposited on Si and Al2O3/Si substrates using a screen printing technique. X-ray diffractometry, scanning electron microscopy and magnetometry were used to characterize and correlate the ferrite films' microstructure and magnetic properties. The experiments indicated that an Al2O3 underlayer was effective in preventing silicon diffusion into the barium ferrite films during a final sintering treatment at temperatures above 1100 °C. A two-stage sintering process allowed a reasonable tradeoff between mechanical and magnetic properties. This work reveals the feasibility of fabrication of thick ferrite films on large substrates (up to 25 mm in diameter) for future planar microwave devices compatible with semiconductor integrated circuits processing.

  12. High frequency broadband PZT thick film ultrasonic transducers for medical imaging applications.

    PubMed

    Zhang, Q Q; Djuth, F T; Zhou, Q F; Hu, C H; Cha, J H; Shung, K K

    2006-12-22

    A modified sol-gel method is used to prepare PZT thick film on Pt-coated silicon substrate. A new method of vacuum filling sol-gel precursor solution is introduced to improve film quality. The effects of the filling on PZT thick film structure and ferroelectric properties are discussed. The fabrication of a high frequency transducer with the PZT film as the actuating layer is described. The performance of the transducer is measured and results show that the transducer backed by E-Solder without a matching layer has a center frequency of 103 MHz and a bandwidth of 70%. Beam profile measurements show that the transducer has an axial resolution of 9.2 microm and a lateral resolution of 33 microm.

  13. Fabrication and properties of FePt thick films for alternative local field micromagnet

    SciTech Connect

    Jang, Pyungwoo; Lee, Bonghan; Seomoon, Kyu; Rhie, Kungwon; Choi, Sungwon

    2009-04-01

    Growth of FePt films thicker than several tens of a micrometer was attempted on Fe substrates for the use of micromagnets. Several underlayer or intermediate layers were found to be totally ineffective to success. However, 20 {mu}m thick FePt films on the Fe substrates were successfully grown by sputtering after HF surface treatment. (BH){sub max} of the non-annealed film was about 10.7 MG Oe under a maximum applied field of 10 kOe. An excellent adhesion between the Fe substrate and the FePt thick films seems to be due to both improvement of surface cleanliness and roughening which enhanced the chemical and physical bonding strengths.

  14. Transport Behavior of Ultrathin Films with NanoThickness Undulations in the Strongly Localized Regime

    NASA Astrophysics Data System (ADS)

    Joy, J. C.; Hollen, S. M.; Zhao, C.; Fernandes, G.; Xu, J. M.; Valles, J. M., Jr.

    2013-03-01

    Recent work on thin films of superconducting material grown on anodized aluminum oxide (AAO) has revealed the existence of a Cooper Pair Insulator (CPI), a state in which superconducting pair correlations survive, but with activated transport dominated by electron pairs. AFM data has revealed that the AAO substrates have a regular undulating structure, which causes films to grow with predictable variations in thickness. These thickness undulations, which have a spatial period greater than the superconducting coherence length, work to localize Cooper pairs in the insulating state. To gain insight into the properties of the normal state of the CPI, we are investigating the transport properties of Copper films grown on AAO substrates. Early data indicate activated transport with activation energies of approximately 20 K in the most insulating films. This work was supported by the NSF through grants No. DMR-0605797 and DMR-0907357 and by the AFRL, the ONR, the AFOSR, and the WCU program at SNU, Korea.

  15. Laser drilling of vias in dielectric for high density multilayer LSHI thick film circuits

    NASA Technical Reports Server (NTRS)

    Cocca, T.; Dakesian, S.

    1977-01-01

    A design analysis of a high density multilevel thick film digital microcircuit used for large scale integration is presented. The circuit employs 4 mil lines, 4 mil spaces and requires 4 mil diameter vias. Present screened and fired thick film technology is limited on a production basis to 16 mil square vias. A process whereby 4 mil diameter vias can be fabricated in production using laser technology was described along with a process to produce 4 mil diameter vias for conductor patterns which have 4 mil lines and 4 mil spacings.

  16. Evaluation of the EHL Film Thickness and Extreme Pressure Additives on Gear Surface Fatigue Life

    NASA Technical Reports Server (NTRS)

    Townsend, Dennis P.; Shimski, John

    1994-01-01

    Surface pitting fatigue life tests were conducted with seven lubricants, using AISI 9310 spur gears. The test lubricants can be classified as synthetic polyol-esters with various viscosities and additive packages. The lubricant with a viscosity that provided a specific film thickness greater than one and with an additive package produced gear surface fatigue lives that were 8.6 times that for lubricants with a viscosity that provided specific film thickness less than one. Lubricants with the same viscosity and similar additive packages gave equivalent gear surface fatigue lives.

  17. Fast approach for calculating film thicknesses and pressures in elastohydrodynamically lubricated contacts at high loads

    NASA Technical Reports Server (NTRS)

    Houpert, L. G.; Hamrock, B. J.

    1985-01-01

    The film thicknesses and pressures in elastohydrodynamically lubricated contacts have been calculated for a line contact by using an improved version of Okamura's approach. The new approach allows for lubricant compressibility, the use of Roelands' viscosity, a general mesh (nonconstant step), and accurate calculations of the elastic deformation. The new approach is described, and the effects on film thickness, pressure, and pressure spike of each of the improvements are discussed. Successful runs have been obtained at high pressure (to 4.8 GPa) with low CPU times.

  18. Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films

    SciTech Connect

    Behler, Anna; Teichert, Niclas; Auge, Alexander; Hütten, Andreas; Dutta, Biswanath; Hickel, Tilmann; Waske, Anja; Eckert, Jürgen

    2013-12-15

    A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni{sub 50}Mn{sub 32}Sn{sub 18} thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.

  19. Effects of supply conditions on film thickness in lubricated Hertzian contacts

    NASA Technical Reports Server (NTRS)

    Dalmaz, G.; Godet, M.

    1980-01-01

    A generalization of the hydrodynamic expression for Hertzian contacts is described and various methods for calculating the thickness of the oil film winter steady-state, isothermal conditions are given. This is important for engineering applications such as gears and bearings because these results are closer to real operating conditions. Theories of lubrication are discussed, and the mathematics involved are presented using approximately 30 equations and 13 figures. For lubricated, linear, elliptical or point Hertzian contacts it is demonstrated how to calculate the thickness of the oil film at the center of the contact for steady-state isothermal conditions.

  20. A lidar system for remote measurement of oil film thickness on sea surface

    SciTech Connect

    Piskozub, J.; Drozdowska, V.; Varlamov, V.

    1997-06-01

    A new lidar system FLS-UV designed for measurement of oil film thickness is described. The system consisting of solid state 299 nm laser and a multichannel spectral receiver was produced by LDI Ltd, Tallinn Estonia in close collaboration with Laser Laboratory of Institute of Oceanology, Sopot, Poland. The system is able to measure oil film thickness in the range of 0.5 - 10 micrometers. It utilizes two methods: light absorption of Raman band in UV and measurement of fluorescence band intensity. The system is designed for continuous measurement from ship or low altitude aircraft. Technical description of the system as well as first experimental results are presented.

  1. Impact of film thickness on the morphology of mesoporous carbon films using organic-organic self-assembly.

    PubMed

    Vogt, Bryan D; Chavez, Vicki L; Dai, Mingzhi; Arreola, M Regina Croda; Song, Lingyan; Feng, Dan; Zhao, Dongyuan; Perera, Ginusha M; Stein, Gila E

    2011-05-03

    Mesoporous polymer and carbon thin films are prepared by the organic-organic self-assembly of an oligomeric phenolic resin with an amphiphilic triblock copolymer template, Pluronic F127. The ratio of resin to template is selected such that a body-centered cubic (Im3m) mesostructure is formed in the bulk. However, well-ordered mesoporous films are not always obtained for thin films (<100 nm), and this behavior is found to be directly correlated with the initial phenolic resin to template ratio. Furthermore, the symmetry of ordered phases is highly dependent on the number of layers of spheres in the film: Monolayers and bilayers are characterized by hexagonal close-packed (HCP) symmetry, while films with approximately 5 layers of spheres exhibit a mixture of HCP and face-centered orthorhombic (FCO) structures. Ultrathick films having more than 30 layers of spheres are similar to the bulk body-centered cubic symmetry with a preferential orientation of the closest-packed (110) plane parallel to the substrate. Film thickness and initial composition of the carbonizable precursors in the template are critical factors in determining the morphology of mesoporous carbon films. These results provide insight into why difficulties have been reported in producing ultrathin ordered mesoporous carbon films using cooperative organic-organic self-assembly.

  2. Ultrasonic oil-film thickness measurement: an angular spectrum approach to assess performance limits.

    PubMed

    Zhang, Jie; Drinkwater, Bruce W; Dwyer-Joyce, Rob S

    2007-05-01

    The performance of ultrasonic oil-film thickness measurement in a ball bearing is quantified. A range of different viscosity oils (Shell T68, VG15, and VG5) are used to explore the lowest reflection coefficient and hence the thinnest oil-film thickness that the system can measure. The results show a minimum reflection coefficient of 0.07 for both oil VG15 and VG5 and 0.09 for oil T68 at 50 MHz. This corresponds to an oil-film thickness of 0.4 microm for T68 oil. An angular spectrum (or Fourier decomposition) approach is used to analyze the performance of this configuration. This models the interaction of component plane waves with the measurement system and quantifies the effect of the key parameters (transducer aperture, focal length, and center frequency). The simulation shows that for a focused transducer the reflection coefficient tends to a limiting value at small oil-film thickness. For the transducer used in this paper it is shown that the limiting reflection coefficient is 0.05 and the oil-film measurement errors increase as the reflection coefficient approaches this value. The implications for improved measurement systems are then discussed.

  3. Formation of Thick Dense Yttrium Iron Garnet Films Using Aerosol Deposition.

    PubMed

    Johnson, Scooter D; Glaser, Evan R; Kub, Fritz J; Eddy, Charles R

    2015-05-15

    Aerosol deposition (AD) is a thick-film deposition process that can produce layers up to several hundred micrometers thick with densities greater than 95% of the bulk. The primary advantage of AD is that the deposition takes place entirely at ambient temperature; thereby enabling film growth in material systems with disparate melting temperatures. This report describes in detail the processing steps for preparing the powder and for performing AD using the custom-built system. Representative characterization results are presented from scanning electron microscopy, profilometry, and ferromagnetic resonance for films grown in this system. As a representative overview of the capabilities of the system, focus is given to a sample produced following the described protocol and system setup. Results indicate that this system can successfully deposit 11 µm thick yttrium iron garnet films that are  > 90% of the bulk density during a single 5 min deposition run. A discussion of methods to afford better control of the aerosol and particle selection for improved thickness and roughness variations in the film is provided.

  4. Thick adherent dielectric films on plastic substrates and method for depositing same

    DOEpatents

    Wickboldt, Paul; Ellingboe, Albert R.; Theiss, Steven D.; Smith, Patrick M.

    2002-01-01

    Thick adherent dielectric films deposited on plastic substrates for use as a thermal barrier layer to protect the plastic substrates from high temperatures which, for example, occur during laser annealing of layers subsequently deposited on the dielectric films. It is desirable that the barrier layer has properties including: a thickness of 1 .mu.m or greater, adheres to a plastic substrate, does not lift-off when cycled in temperature, has few or no cracks and does not crack when subjected to bending, resistant to lift-off when submersed in fluids, electrically insulating and preferably transparent. The thick barrier layer may be composed, for example, of a variety of dielectrics and certain metal oxides, and may be deposited on a variety of plastic substrates by various known deposition techniques. The key to the method of forming the thick barrier layer on the plastic substrate is maintaining the substrate cool during deposition of the barrier layer. Cooling of the substrate maybe accomplished by the use of a cooling chuck on which the plastic substrate is positioned, and by directing cooling gas, such as He, Ar and N.sub.2, between the plastic substrate and the cooling chucks. Thick adherent dielectric films up to about 5 .mu.m have been deposited on plastic substrates which include the above-referenced properties, and which enable the plastic substrates to withstand laser processing temperatures applied to materials deposited on the dielectric films.

  5. Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

    NASA Astrophysics Data System (ADS)

    Intaniwet, Akarin; Mills, Christopher A.; Shkunov, Maxim; Thiem, Heiko; Keddie, Joseph L.; Sellin, Paul J.

    2009-09-01

    Thick film (≥5 μm thick) semiconducting polymer diodes incorporating poly(triarylamine) (PTAA) have been produced and applied as direct x-ray detectors. Experiments determined that a rectifying diode behavior persists when increasing the thickness of the active layer above typical thin film thicknesses (<1 μm), and the electrical conduction mechanism of the diodes has been identified. Direct current and photoconductivity measurements on indium tin oxide/poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate)/PTAA/metal diodes confirm that carrier conduction occurs via a Poole-Frenkel mechanism. The energy band structure of diodes (having gold or aluminum top electrodes) has been elucidated and used to explain the resulting electrical characteristics. Theoretical calculations show that, upon irradiation with x-rays, the diode quantum efficiency increases with increasing polymer film thickness. The diodes produced here display characteristics similar to their thin film analogs, meaning that they may be operated in a similar way and therefore may be useful for radiation dosimetry applications. Upon irradiation, the diodes produce an x-ray photocurrent that is proportional to the dose, thus demonstrating their suitability for direct x-ray detectors. The x-ray photocurrent remains the same in a device after a cumulative exposure of 600 Gy and after aging for 6 months.

  6. Diode laser-based standoff absorption measurement of water film thickness in retro-reflection

    NASA Astrophysics Data System (ADS)

    Pan, R.; Brocksieper, C.; Jeffries, J. B.; Dreier, T.; Schulz, C.

    2016-09-01

    A dual-wavelength diode laser-based absorption sensor for standoff point measurements of water film thickness on an opaque surface is presented. The sensor consists of a diode laser source, a foil as backscattering target, and off-axis paraboloids for collecting the fraction of the laser radiation transmitted through the liquid layer via retro-reflection. Laser wavelengths in the near infrared at 1412 and 1353 nm are used where the temperature dependence of the liquid water absorption cross section is known. The lasers are fiber coupled and the detection of the retro-reflected light was accomplished through a multimode fiber and a single photodiode using time-division multiplexing. The water film thickness at a given temperature was determined from measured transmittance ratios at the two laser wavelengths. The sensor concept was first validated with measurement using a temperature-controlled calibration cell providing liquid layers of variable and known thickness between 100 and 1000 µm. Subsequently, the sensor was demonstrated successfully during recording the time-varying thickness of evaporating water films at fixed temperatures. The film thickness was recorded as a function of time at three temperatures down to 50 µm.

  7. Smoothness improvement of micrometer- and submicrometer-thick nanocrystalline diamond films produced by MWPECVD

    NASA Astrophysics Data System (ADS)

    Cicala, G.; Magaletti, V.; Senesi, G. S.; Tamborra, M.

    2013-04-01

    Thick (around 3 μm) and thin (48-310 nm) nanocrystalline diamond (NCD) films have been produced from Ar-rich CH4/Ar/H2 (1/89/10 %) and H2-rich CH4/H2 (1/99 %) microwave plasmas, respectively. The deposition rate and the nucleation enhancement have been monitored in situ and in real time by pyrometric and laser reflectance interferometry for micrometer- and nanometer-thick films. For thick films, an improvement of the NCD films' smoothness has been obtained by a buffer layer between the films and the treated Si substrate. For thin films, a combinatorial approach, i.e., a treatment of the Si substrate in a suspension of mixed diamond powders of 250 nm and 40-60 μm, has been utilized. The present experimental results show that the buffer layer procedure allows good preservation of the surface of the treated Si substrate and the combinatorial approach promotes effectively the seeding of the Si surface.

  8. Image processing techniques for measuring non-uniform film thickness profiles

    SciTech Connect

    Nitta, S.V.; Liu, An-Hong; Plawsky, J.L.; Wayner, P.C. Jr.

    1996-12-31

    The long term objective of this research program is to determine the fluid flow and drying characteristics of thin liquid/solid films using image processing techniques such as Image Analyzing Interferometry (IAI) and Image Scanning Ellipsometry (ISE). The primary purpose of this paper is to present experimental data on the effectiveness of IAI and ISE to measure nonuniform film thickness profiles. Steady-state, non-isothermal profiles of evaporating films were measured using IAI. Transient thickness profiles of a draining film were measured using ISE. The two techniques are then compared and contrasted. The ISE can be used to measure transient as well as steady-state profiles of films with thickness ranging from 1 nm to > 20 {mu}m, whereas IAI can be used to directly measure Steady-state and transient profiles of only films thicker than about 100 nm. An evaluation of the reflected intensity can be used to extend the use of the IAI below 100 nm.

  9. Effect of starvation on film thickness and traction under elastohydrodynamic rolling and sliding conditions

    NASA Technical Reports Server (NTRS)

    Wedeven, L. D.

    1975-01-01

    Traction measurements under starved elastohydrodynamic conditions were obtained for a point-contact geometry. Simultaneous measurements of the film thickness and the location of the inlet lubricant boundary were made. Optical interferometry was used to measure film thickness. The thickness of a starved film for combined rolling and sliding conditions varies with the location of the inlet boundary in the same way as previously found for pure rolling conditions. When the fluid velocity distribution is calculated in the inlet region by a Reynolds lubrication analysis, backflow is seen to occur over a portion of the inlet region. Backflow is essential for the establishment of a flooded condition. The location of certain fluid velocity conditions within the inlet region, as suggested in the literature, does not adequately describe the onset of starvation. For the same slide-roll ratio a starved film was observed to possess greater traction than a flooded film. Traction measurements under starved conditions were also compared with those under flooded conditions for equivalent shear rates in the Hertzian region. When the shear rates within the Hertzian region were low and the film was severely starved, the measured tractions were lower than expected. This may be due to large shear stresses developed by the large pressure gradients that are generated in the inlet region when it is severely starved.

  10. Thickness effect on the structural and electrical properties of poly-SiGe films

    SciTech Connect

    Asafa, T.B.; Witvrouw, A.; Schneider, D.; Moussa, A.; Tabet, N.; Said, S.A.M.

    2014-01-01

    Graphical abstract: - Highlights: • Stress and Young's modulus of poly-SiGe film are linked to the grain columnar structure. • The above properties remain unchanged for poly-SiGe films thicker than 40 nm. • The point of transition is close to the electron mean free path for SiGe. • Both the resistivity and Hall mobility follow a similar trend. - Abstract: As lateral dimensions of electromechanical devices are scaled down to length scales comparable to electron mean free paths, the influence of thickness effect on their properties becomes sine qua non. This paper presents a detailed study of thickness effect on the Young's modulus, residual stress, resistivity and Hall mobility of ultrathin poly-Si{sub 11}Ge{sub 89} films deposited by low pressure chemical vapour deposition. The Young's moduli for the films thicker than ∼40 nm are close to the bulk value (135 GPa) while those of the thinner films are much lower. The reduction in resistivity and subsequent improved Hall mobility as thickness increases are discussed in light of surface morphology which is evident from atomic microscopy images. The near constant values of Young's modulus, resistivity and Hall mobility for the films thicker than ∼40 nm are attributed to the columnar grain structure as confirmed by the transmission electron microscopy images.

  11. In situ method for real time measurement of dielectric film thickness in plasmas

    SciTech Connect

    Jang, Sung-Ho; Kim, Gun-Ho; Chung, Chin-Wook

    2010-01-15

    An in situ thickness measurement method of dielectric films (dual frequency method) was developed, and the thicknesses were measured in an inductively coupled plasma. This method uses a small ac bias voltage with two frequencies for thickness measurement. The dielectric thickness is obtained from measuring the amplitudes of the two frequency ac currents through a sensor, as well as using an equivalent circuit model describing impedance of the dielectric film and the plasma sheath. In the experiment, the thicknesses of Al{sub 2}O{sub 3} film could be accurately measured in real time. To check the measurement reliability, the dual frequency method was compared with reflection spectrophotometry as a technique for optical thickness diagnostics. It was found that the dual frequency method agrees closely with reflection spectrophotometry at various rf powers and pressures. In addition, this method is very simple and can be installed anywhere in plasma reactors, in contrast with optical methods; therefore, it is expected to be applied to in situ surface diagnostics for various processing plasmas.

  12. Study of the thickness effect on the dielectric functions by utilizing a wedge-shaped Ti film sample with continuously varied thickness

    NASA Astrophysics Data System (ADS)

    Hu, Er-Tao; Zhang, Rong-Jun; Cai, Qing-Yuan; Wang, Zi-Yi; Xu, Ji-Ping; Zheng, Yu-Xiang; Wang, Song-You; Wei, Yan-Feng; Huang, Ren-Zhong; Chen, Liang-Yao

    2015-09-01

    The dielectric functions of direct-current-sputtered wedge-shaped ultrathin titanium (Ti) film on K9 glass were investigated in this paper. The wedge-shaped Ti thin film was deposited under the identical conditions with continuously varied thickness. Atomic force microscope revealed that the thin film surface was very smooth with the surface roughness of about 0.5 nm. The dielectric functions of the wedge-shaped films in the wavelength range of 300-1200 nm were obtained by a focused-beam ellipsometer with the beam size on the sample about 200 μm. Results show that ɛ 1, the real part of the dielectric function, is negative almost in the whole spectrum region, proving that the film at the measured area is continuous and shows metallic behavior. On the other hand, ɛ 1 decreases with the increase in the film thickness, while ɛ 2, the imaginary part of the dielectric function, has the opposite variation tendency. The changing of ɛ 1 with film thickness is due to the reduced electron-electron interactions and enhanced metallic behavior. While for ɛ 2, it gets larger with the increase in the film thickness, which is mainly owing to the decrease in the tensile stress in the film.

  13. The Effects of Film Thickness and Evaporation Rate on Si-Cu Thin Films for Lithium Ion Batteries.

    PubMed

    Polat, B Deniz; Keles, Ozgul

    2015-12-01

    The reversible cyclability of Si based composite anodes is greatly improved by optimizing the atomic ratio of Si/Cu, the thickness and the evaporation rates of films fabricated by electron beam deposition method. The galvanostatic test results show that 500 nm thick flim, having 10%at. Cu-90%at. Si, deposited with a moderate evaporation rate (10 and 0.9 Å/s for Si and Cu respectively) delivers 2642.37 mAh g(-1) as the first discharge capacity with 76% Coulombic efficiency. 99% of its initial capacity is retained after 20 cycles. The electron conductive pathway and high mechanical tolerance induced by Cu atoms, the low electrical resistivity of the film due to Cu3Si particles, and the homogeneously distributed nano-sized/amorphous particles in the composite thin film could explain this outstanding electrochemical performance of the anode.

  14. Characterization of Failed Surface of Ti and Imidex (PI) Film for Different Inter-layer Thicknesses of Ti Film

    NASA Astrophysics Data System (ADS)

    Lubna, Nusrat; Chaudhury, Zariff; Newaz, Golam

    2012-09-01

    For miniaturized biomedical devices, laser joining of dissimilar materials offers excellent potential to make precise joints. An important system for consideration is titanium (Ti) coated glass joined with biocompatible imidex polyimide (PI). Metallic Ti with various thicknesses was deposited on top of pyrex 7740 borosilicate glass by using DC-magnetron sputtering deposition method. Effect of bond strength between Ti coated glass and imidex polyimide (PI), due to thickness variation of sputtered Ti coating was studied. Three different Ti inter-layer thicknesses were considered, 50, 200, and 400 nm. Tests results indicated that the thinner film produced lower shear strength and higher thickness produced higher shear strength. It has been observed that thicker film (200 and 400 nm) enhanced considerably the bond strength with enhancing the film roughness as well. Higher roughness resulted in more contact area at the interface, results higher number of chemical bonds and increased mechanical interlocking; which in turn increase the laser joint strength. For stronger bond with higher thickness, mixed mode failure was observed which included cohesive failure of polymer, interface failure of Ti/glass and failure on the glass itself. On the other hand, for weak bond with thinner film, mostly interface failure was observed for this system of Ti coated glass/imidex. For thicker film, chemical bond of Ti-C and Ti-O were observed. The role of both surface characteristics and chemical bonding for laser joints were investigated by using advanced techniques such as X-ray photoelectron spectroscopy, scanning electron microscopy, and energy dispersive spectroscopy.

  15. Determining the refractive index and thickness of thin films from prism coupler measurements

    NASA Technical Reports Server (NTRS)

    Kirsch, S. T.

    1981-01-01

    A simple method of determining thin film parameters from mode indices measured using a prism coupler is described. The problem is reduced to doing two least squares straight line fits through measured mode indices vs effective mode number. The slope and y intercept of the line are simply related to the thickness and refractive index of film, respectively. The approach takes into account the correlation between as well as the uncertainty in the individual measurements from all sources of error to give precise error tolerances on the best fit values. Due to the precision of the tolerances, anisotropic films can be identified and characterized.

  16. Thickness-Dependent Structural and Optoelectronic Properties of In2O3 Films Prepared by Spray Pyrolysis Technique

    NASA Astrophysics Data System (ADS)

    Khan, M. A. Majeed; Khan, Wasi

    2016-08-01

    In this work, nanostructured In2O3 thin films with thickness in the range of 40-160 nm were deposited on glass substrates by the chemical spray pyrolysis technique. The microstructural, surface morphology and optical properties were investigated as a function of film thickness through x-ray diffraction, scanning electron microscopy equipped with energy dispersive spectroscopy, atomic force microscopy, Raman spectroscopy, UV-visible spectroscopy and photoluminescence measurements. The x-ray diffraction analysis showed that the deposited films were polycrystalline in nature with a cubic structure having (222) as preferred orientation. The morphological analyses of the samples exhibited uniform and smooth surface of the films with systematical increments in the surface roughness with increasing film thickness. The grain size increased from 9 nm to 13 nm with increasing film thickness. Raman spectroscopy has been employed to study the crystalline quality and the structural disorder of the films. A blue-shift in the energy band gap ( E g) from 3.74 eV to 3.98 eV was observed with the increase of film thickness. Moreover, photoluminescence peaks of the In2O3 films appeared at 443 nm and 527 nm for all films. The thickness had a substantial influence on the microstructural and optical properties as well as on the luminescence intensity of the films. The strategy presented here indicates that the prepared films could be suitable candidates for optoelectronic device applications.

  17. Pre-corneal tear film thickness in humans measured with a novel technique

    PubMed Central

    Azartash, Kaveh; Kwan, Justin; Paugh, Jerry R.; Nguyen, Andrew Loc; Jester, James V.

    2011-01-01

    Purpose The purpose of this work was to gather preliminary data in normals and dry eye subjects, using a new, non-invasive imaging platform to measure the thickness of pre-corneal tear film. Methods Human subjects were screened for dry eye and classified as dry or normal. Tear film thickness over the inferior paracentral cornea was measured using laser illumination and a complementary metal–oxide–semiconductor (CMOS) camera. A previously developed mathematical model was used to calculate the thickness of the tear film by applying the principle of spatial auto-correlation function (ACF). Results Mean tear film thickness values (±SD) were 3.05 μm (0.20) and 2.48 μm (0.32) on the initial visit for normals (n=18) and dry eye subjects (n=22), respectively, and were significantly different (p<0.001, 2-sample t-test). Repeatability was good between visit 1 and 2 for normals (intraclass correlation coefficient [ICC]=0.935) and dry eye subjects (ICC=0.950). Tear film thickness increased above baseline for the dry eye subjects following viscous drop instillation and remained significantly elevated for up to approximately 32 min (n=20; p<0.05 until 32 min; general linear mixed model and Dunnett’s tests). Conclusions This technique for imaging the ocular surface appears to provide tear thickness values in agreement with other non-invasive methods. Moreover, the technique can differentiate between normal and dry eye patient types. PMID:21527997

  18. Effect of film thickness on the magneto-structural properties of ion beam sputtered transition metal-metalloid FeCoNbB/Si (100) alloy thin films

    NASA Astrophysics Data System (ADS)

    Gupta, Pooja; Tripathi, Yagyanidhi; Kumar, Dileep; Rai, S. K.; Gupta, Mukul; Reddy, V. R.; Svec, Peter

    2016-08-01

    The structure and magnetic properties of ion beam sputtered transition metal-metalloid FeCoNbB/Si(100) alloy thin film have been studied as a function of film thickness using complementary techniques of x-ray reflectivity (XRR), grazing incidence x-ray diffraction, and magneto optical Kerr effect. Thicknesses of the films range from ˜200 to 1500 Å. The coercivity of all the films ranges between 4 and 14 Oe, which suggests soft magnetic nature of FeCoNbB/Si thin films. Films with thickness up to 800 Å are amorphous in nature and are found to possess uniaxial magnetic anisotropy in the film plane, although no magnetic field was applied during deposition. The presence of the two fold symmetry in such amorphous thin films may be attributed to quenched-in stresses developed during deposition. Upon increasing the film thickness to ˜1200 Å and above, the structure of FeCoNbB films transforms from amorphous to partially nanocrystalline structure and has bcc-FeCo nanocrystalline phase dispersed in remaining amorphous matrix. The crystalline volume fraction (cvf) of the films is found to be proportional to the film thickness. Azimuthal angle dependence of remanence confirms the presence of in-plane four-fold anisotropy (FFA) in the crystalline film with cvf ˜75%. Synchrotron x-ray diffraction measurement using area detector suggests random orientation of crystallites and thus clearly establishes that FFA is not related to texture/cubic symmetry in such polycrystalline thin films. As supported by asymmetric Bragg diffraction measurements, the origin of FFA in such partially crystalline thin film is ascribed to the additional compressive stresses developed in the film upon crystallization. Results indicate that promising soft magnetic properties in such films can be optimized by controlling the film thickness. The revelation of controllable and tunable anisotropy suggests that FeCoNbB thin films can have potential application in electromagnetic applications.

  19. Modulation of ZnO film thickness and formation of water-hyacinth nanostructure

    NASA Astrophysics Data System (ADS)

    Gunasekaran, Ezhilarasan; Shankar, Prabakaran; Mani, Ganesh Kumar; Bosco Balaguru Rayappan, John

    2014-08-01

    The influence of precursor medium was investigated on the structural, morphological, optical and electrical properties of spray pyrolysis deposited nanostructured ZnO thin films. Three batches of ZnO thin films were deposited on glass substrates using three different solvents (water, water-ethanol [ratio of 1:1] and ethanol) based precursor solution of zinc nitrate hexahydrate. The substrate temperature was fixed at 523 K. The variation in film thickness from 150 to 875 nm was observed as the effect of changing solvent medium. X-ray diffraction (XRD) data confirmed the formation of polycrystalline ZnO thin films with hexagonal wurtzite crystallite structure and the estimated crystallite size was found to be ranging from 31 to 55 nm. Scanning electron micrographs revealed the formation of water-hyacinth shaped nanostructures when water-ethanol mixture was used as the solvent medium. Interestingly, UV-vis spectrophotometer revealed the formation of ZnO film with twin optical band gap of 3.15 eV and 3.56 eV when ethanol was used as the solvent medium. The modulation of film thickness and grain size by solvent medium has strongly influenced the electrical conductivity of ZnO thin films. The homogenous nano-spherical grains with uniform grain boundaries showed a good response towards 100 ppm of ammonia at room temperature.

  20. Variable Thickness Liquid Crystal Films for High Repetition Rate Laser Applications

    NASA Astrophysics Data System (ADS)

    Poole, Patrick; Willis, Christopher; Cochran, Ginevra; Hanna, Randall; Andereck, C. David; Schumacher, Douglass

    2015-05-01

    The presentation of a clean target or target substrate at high repetition rates is of importance to a number of photoelectron spectroscopy and free electron laser applications, often in high vacuum environments. Additionally, high intensity laser facilities are approaching the 10 Hz shot rate at petawatt powers, but are currently unable to insert targets at these rates. We have developed liquid crystal films to address this need for high rep rate targets while preserving the planar geometry advantageous to many applications. The molecular ordering of liquid crystal is variable with temperature and can be manipulated to form a layered thin film. In this way temperature and volume control can be used to vary film thickness in vacuo and on-demand between 10 nm and over 10 μm. These techniques were previously applied to a single-shot ion acceleration experiment in, where target thickness critically determines the physics of the acceleration. Here we present an automatic film formation device that utilizes a linear sliding rail to form liquid crystal films within the aforementioned range at rates up to 0.1 Hz. The design ensures film formation location within 2 μm RMS, well within the Rayleigh range of even short f-number systems. Details of liquid crystal films and this target formation device will be shown as well as recent experimental data from the Scarlet laser facility at OSU. This work was supported by DARPA through a grant from AMRDEC.

  1. Pb(Zr,Ti)O3 ceramic thick films for optical device applications

    NASA Astrophysics Data System (ADS)

    Cardin, J.; Leduc, D.; Boisrobert, C.; Gundel, Hartmut W.

    2003-08-01

    Ferroelectric PbxZryTi1-yO3 (PZT) has been prepared by chemical solution deposition (CSD) and spin-coating technique, using acetate and alkoxide precursors. Rapid thermal annealing has been employed in order to obtain crystallization in the perovskite phase. Aiming to study the optical properties of the films, PZT was deposited on different glass substrates. Structural characterization of the films was done by X-ray diffraction, morphology was investigated by SEM micrography. Using standard photography analysis, the films were qualified in terms of crack density, their appearance strongly depending on the type of substrate. Using a visible to the near infrared spectrophotometer, the transmittance normal to the surface of the films was studied. Coupling of laser light into the films by the M-lines technique allowed the determination of the refractive index and the thickness of the ferroelectric layer. A waveguiding interferometer structure of Mach-Zehnder type was realized by photolithography and wet chemical etching.

  2. Full-field optical thickness profilometry of semitransparent thin films with transmission densitometry

    SciTech Connect

    Johnson, Jay; Harris, Tequila

    2010-05-20

    A novel bidirectional thickness profilometer based on transmission densitometry was designed to measure the localized thickness of semitransparent films on a dynamic manufacturing line. The densitometer model shows that, for materials with extinction coefficients between 0.3 and 2.9 D/mm, 100-500 {mu}m measurements can be recorded with less than {+-}5% error at more than 10,000 locations in real time. As a demonstration application, the thickness profiles of 75 mmx100 mm regions of polymer electrolyte membrane (PEM) were determined by converting the optical density of the sample to thickness with the Beer-Lambert law. The PEM extinction coefficient was determined to be 1.4 D/mm, with an average thickness error of 4.7%.

  3. CO Responses of Sensors Based on Cerium Oxide Thick Films Prepared from Clustered Spherical Nanoparticles

    PubMed Central

    Izu, Noriya; Matsubara, Ichiro; Itoh, Toshio; Akamatsu, Takafumi; Shin, Woosuck

    2013-01-01

    Various types of CO sensors based on cerium oxide (ceria) have been reported recently. It has also been reported that the response speed of CO sensors fabricated from porous ceria thick films comprising nanoparticles is extremely high. However, the response value of such sensors is not suitably high. In this study, we investigated methods of improving the response values of CO sensors based on ceria and prepared gas sensors from core-shell ceria polymer hybrid nanoparticles. These hybrid nanoparticles have been reported to have a unique structure: The core consists of a cluster of ceria crystallites several nanometers in size. We compared the characteristics of the sensors based on thick films prepared from core-shell nanoparticles with those of sensors based on thick films prepared from conventionally used precipitated nanoparticles. The sensors prepared from the core-shell nanoparticles exhibited a resistance that was ten times greater than that of the sensors prepared from the precipitated nanoparticles. The response values of the gas sensors based on the core-shell nanoparticles also was higher than that of the sensors based on the precipitated nanoparticles. Finally, improvements in sensor response were also noticed after the addition of Au nanoparticles to the thick films used to fabricate the two types of sensors. PMID:23529123

  4. CO responses of sensors based on cerium oxide thick films prepared from clustered spherical nanoparticles.

    PubMed

    Izu, Noriya; Matsubara, Ichiro; Itoh, Toshio; Akamatsu, Takafumi; Shin, Woosuck

    2013-03-08

    Various types of CO sensors based on cerium oxide (ceria) have been reported recently. It has also been reported that the response speed of CO sensors fabricated from porous ceria thick films comprising nanoparticles is extremely high. However, the response value of such sensors is not suitably high. In this study, we investigated methods of improving the response values of CO sensors based on ceria and prepared gas sensors from core-shell ceria polymer hybrid nanoparticles. These hybrid nanoparticles have been reported to have a unique structure: The core consists of a cluster of ceria crystallites several nanometers in size. We compared the characteristics of the sensors based on thick films prepared from core-shell nanoparticles with those of sensors based on thick films prepared from conventionally used precipitated nanoparticles. The sensors prepared from the core-shell nanoparticles exhibited a resistance that was ten times greater than that of the sensors prepared from the precipitated nanoparticles. The response values of the gas sensors based on the core-shell nanoparticles also was higher than that of the sensors based on the precipitated nanoparticles. Finally, improvements in sensor response were also noticed after the addition of Au nanoparticles to the thick films used to fabricate the two types of sensors.

  5. Synthesis and characterization of thick PZT films via sol-gel dip coating method

    NASA Astrophysics Data System (ADS)

    Shakeri, Amid; Abdizadeh, Hossein; Golobostanfard, Mohammad Reza

    2014-09-01

    Thick films of lead zirconate titanate (PZT) offer possibilities for micro-electro-mechanical systems such as high frequency ultrasonic transducers. In this paper, crack-free thick films of PZT have been prepared up to 45 μm thickness via modified sol-gel dip coating method. In this procedure, acetic acid-alcoholic based sol is used by applying diethanolamine (DEA) and deionized water as additives. The effects of DEA and water on the crystal structure and surface morphology of the films are investigated. The mechanisms of acetic acid and DEA complexations are introduced by using FTIR spectrometer which illustrates suitable substitution of complexing agents with alkoxide groups. DEA/(Ti + Zr) = 0.5 or water/(Ti + Zr) = 0.5 are determined as the optimum molar ratio of additives, which lead to the formation of almost pure perovskite phase with the tetragonal lattice parameters of ct = 4.16 Ǻ and at = 4.02 Ǻ and a distortion of 2%. Values of remanent polarization and dielectric constant of 7.8 μC cm-2 and 1630 were obtained for 45 μm thick films, respectively.

  6. Thickness Dependence of the Quantum Anomalous Hall Effect in Magnetic Topological Insulator Films.

    PubMed

    Feng, Xiao; Feng, Yang; Wang, Jing; Ou, Yunbo; Hao, Zhenqi; Liu, Chang; Zhang, Zuocheng; Zhang, Liguo; Lin, Chaojing; Liao, Jian; Li, Yongqing; Wang, Li-Li; Ji, Shuai-Hua; Chen, Xi; Ma, Xucun; Zhang, Shou-Cheng; Wang, Yayu; He, Ke; Xue, Qi-Kun

    2016-08-01

    The evolution of the quantum anomalous Hall effect with the thickness of Cr-doped (Bi,Sb)2 Te3 magnetic topological insulator films is studied, revealing how the effect is caused by the interplay of the surface states, band-bending, and ferromagnetic exchange energy. Homogeneity in ferromagnetism is found to be the key to high-temperature quantum anomalous Hall material.

  7. Electrochemical characterization of YSZ thick films deposited by dip-coating process

    NASA Astrophysics Data System (ADS)

    Mauvy, F.; Lenormand, P.; Lalanne, C.; Ansart, F.; Bassat, J. M.; Grenier, J. C.; Groupement de Recherches Cnrs "Pacte", Gdr 2985

    Yttria stabilized zirconia (YSZ, 8% Y 2O 3) thick films were coated on dense alumina substrates by a dip-coating process. The suspension was obtained by addition of a polymeric matrix in a stable suspension of commercial YSZ (Tosoh) powders dispersed in an azeotropic mixture MEK-EtOH. The suspension composition was improved by the addition of YSZ Tosoh particles encapsulated by zirconium alkoxide sol containing yttrium nitrate which are the precursors of the 8-YSZ oxide. This optimal formulation allowed preparing, via a dip-coating process, thick films which were, after thermal treatment, homogeneous, dense and crack-free. A specific method was performed to measure the electrical conductivity, i.e. to determine the ionic conductivity of the film: it uses the four-point probe technique combined with ac impedance spectroscopy. The good agreement between the classical two-electrode measurements performed on YSZ pellets and the four-electrode ones performed on YSZ films allows concluding that this method is relevant for characterizing the transport properties of thick films.

  8. Pad-printed thick-film transducers for high-frequency and high-power applications

    NASA Astrophysics Data System (ADS)

    Wolny, Wanda W.; Ketterling, Jeffrey A.; Levassort, Franck; Lou-Moeller, Rasmus; Filoux, Erwan; Mamou, Jonathan; Silverman, Ronald H.; Lethiecq, Marc

    2011-03-01

    High-frequency-ultrasound transducers are widely used but are typically based either on planar piezoceramic sections that are lapped down to smaller thicknesses or on piezopolymers that may be deformed into more complex geometries. Piezoceramics then require dicing to obtain arrays or can be fractured into spherical geometries to achieve focusing. Piezopolymers are not as efficient for very small element sizes and are normally available only in discrete thicknesses. Thick-film (TF) transducers provide a means of overcoming these limits because the piezoelectric film is deposited with the required thickness, size and geometry, thus avoiding any subsequent machining. Thick-film transducers offer the potential of a wide range of geometries such as single-elements and annular or linear arrays. Here, a single-element focused transducer was developed using a piezoceramic composition adapted to high-power operation which is commonly used at standard MHz frequencies. After fabrication, the transducer was characterized. Using specific transmit-receive electronics and a water tank adapted to high-frequency devices, the transducer was excited using a short pulse to evaluate its bandwidth and imaging capabilities. Finally, it was excited by a one-period sine wave using several power levels to evaluate its capacity to produce high-intensity focused ultrasound at frequencies over 20 MHz.

  9. Correlation between active layer thickness and ambient gas stability in IGZO thin-film transistors

    NASA Astrophysics Data System (ADS)

    Gao, Xu; Lin, Meng-Fang; Mao, Bao-Hua; Shimizu, Maki; Mitoma, Nobuhiko; Kizu, Takio; Ou-Yang, Wei; Nabatame, Toshihide; Liu, Zhi; Tsukagoshi, Kazuhito; Wang, Sui-Dong

    2017-01-01

    Decreasing the active layer thickness has been recently reported as an alternative way to achieve fully depleted oxide thin-film transistors for the realization of low-voltage operations. However, the correlation between the active layer thickness and device resistivity to environmental changes is still unclear, which is important for the optimized design of oxide thin-film transistors. In this work, the ambient gas stability of IGZO thin-film transistors is found to be strongly correlated to the IGZO thickness. The TFT with the thinnest IGZO layer shows the highest intrinsic electron mobility in a vacuum, which is greatly reduced after exposure to O2/air. The device with a thick IGZO layer shows similar electron mobility in O2/air, whereas the mobility variation measured in the vacuum is absent. The thickness dependent ambient gas stability is attributed to a high-mobility region in the IGZO surface vicinity with less sputtering-induced damage, which will become electron depleted in O2/air due to the electron transfer to adsorbed gas molecules. The O2 adsorption and deduced IGZO surface band bending is demonstrated by the ambient-pressure x-ray photoemission spectroscopy results.

  10. Thickness effect on magnetocrystalline anisotropy of Co/Pd(111) films: A density functional study

    SciTech Connect

    Jekal, Soyoung; Rhim, S. H. E-mail: schong@ulsan.ac.kr; Kwon, Oryong; Hong, Soon Cheol E-mail: schong@ulsan.ac.kr

    2015-05-07

    In this study, we carried out first-principles calculations on magnetocrystalline anisotropy (MCA) of Co/Pd thin films by adopting two different systems of (i) n-Co/3-Pd and (ii) n-Pd/3-Co. In one system, we vary the thickness of Co layer, fixing the thickness of the Pd layer to 3-monolayers, and in the other system vice versa. MCA is mainly governed by the surface and interface Co atoms, while contributions from other Co atoms are smaller. MCA energy (E{sub MCA}) of the Co/Pd thin film shows oscillatory behavior with the thickness of the Co layer, but is insensitive to the thickness of the Pd layer. In particular, the n-Co/3-Pd films of n = 2, 4, and 6 exhibit strong perpendicular MCA of about 1 meV. Our results suggest that controlling the thickness of the Co layer in Co/Pd (111) is crucial in achieving strong perpendicular MCA.

  11. Method and system using power modulation and velocity modulation producing sputtered thin films with sub-angstrom thickness uniformity or custom thickness gradients

    DOEpatents

    Montcalm, Claude; Folta, James Allen; Walton, Christopher Charles

    2003-12-23

    A method and system for determining a source flux modulation recipe for achieving a selected thickness profile of a film to be deposited (e.g., with highly uniform or highly accurate custom graded thickness) over a flat or curved substrate (such as concave or convex optics) by exposing the substrate to a vapor deposition source operated with time-varying flux distribution as a function of time. Preferably, the source is operated with time-varying power applied thereto during each sweep of the substrate to achieve the time-varying flux distribution as a function of time. Preferably, the method includes the steps of measuring the source flux distribution (using a test piece held stationary while exposed to the source with the source operated at each of a number of different applied power levels), calculating a set of predicted film thickness profiles, each film thickness profile assuming the measured flux distribution and a different one of a set of source flux modulation recipes, and determining from the predicted film thickness profiles a source flux modulation recipe which is adequate to achieve a predetermined thickness profile. Aspects of the invention include a computer-implemented method employing a graphical user interface to facilitate convenient selection of an optimal or nearly optimal source flux modulation recipe to achieve a desired thickness profile on a substrate. The method enables precise modulation of the deposition flux to which a substrate is exposed to provide a desired coating thickness distribution.

  12. Method for rapid, controllable growth and thickness, of epitaxial silicon films

    DOEpatents

    Wang, Qi; Stradins, Paul; Teplin, Charles; Branz, Howard M.

    2009-10-13

    A method of producing epitaxial silicon films on a c-Si wafer substrate using hot wire chemical vapor deposition by controlling the rate of silicon deposition in a temperature range that spans the transition from a monohydride to a hydrogen free silicon surface in a vacuum, to obtain phase-pure epitaxial silicon film of increased thickness is disclosed. The method includes placing a c-Si substrate in a HWCVD reactor chamber. The method also includes supplying a gas containing silicon at a sufficient rate into the reaction chamber to interact with the substrate to deposit a layer containing silicon thereon at a predefined growth rate to obtain phase-pure epitaxial silicon film of increased thickness.

  13. Cellular-foam polypropylene ferroelectrets with increased film thickness and reduced resonance frequency

    NASA Astrophysics Data System (ADS)

    Sborikas, Martynas; Wegener, Michael

    2013-12-01

    Ferroelectrets are piezoelectric materials suitable for acoustic applications such as airborne ultrasonic transducers. Typical ferroelectrets exhibit resonance frequencies in the high kHz to low MHz range. In order to decrease the transducer resonance frequencies to the low kHz range, processes such as gas-diffusion expansion and electric charging were adjusted to cellular films which are initially twice as thick as in earlier studies. The demonstrated film expansion and electric charging lead to mechanically soft cellular structures which show high piezoelectric activities with coefficients up to 130 pC/N. Due to the simultaneously increased film thicknesses, the resonance frequencies are lowered down to about 233 kHz.

  14. Photochemical Immobilization of Polymers on a Surface: Controlling Film Thickness and Wettability.

    PubMed

    Carroll, Gregory T; Turro, Nicholas J; Mammana, Angela; Koberstein, Jeffrey T

    2017-03-15

    In this manuscript we demonstrate the control of film thickness and surface wettability in the photochemical immobilization of poly (vinyl alcohol) (PVA) to a self-assembled monolayer (SAM) containing a phthalimide chromophore. Surface attachment is characterized by ellipsometry and contact angle measurements. The wettability of the resulting films is shown to depend on the chemical composition of the polymer. The film thickness is shown to depend on the irradiation time and molecular weight of the polymer. Using a photo-mask, micro-patterns of polymers can be grafted to the SAM. The photo-patterned surface can be "developed" by coating with a thin layer of a mixture containing poly (styrene) (PS) and triphenylsulfonium triflate. This article is protected by copyright. All rights reserved.

  15. Systems Issues Pertaining to Holographic Optical Data Storage in Thick Bacteriorhodopsin Films

    NASA Technical Reports Server (NTRS)

    Downie, John D.; Timucin, Dogan A.; Gary, Charles K.; Oezcan, Meric; Smithey, Daniel T.; Crew, Marshall; Lau, Sonie (Technical Monitor)

    1998-01-01

    The optical data storage capacity and raw bit-error-rate achievable with thick photochromic bacteriorhodopsin (BR) films are investigated for sequential recording and read- out of angularly- and shift-multiplexed digital holograms inside a thick blue-membrane D85N BR film. We address the determination of an exposure schedule that produces equal diffraction efficiencies among each of the multiplexed holograms. This exposure schedule is determined by numerical simulations of the holographic recording process within the BR material, and maximizes the total grating strength. We also experimentally measure the shift selectivity and compare the results to theoretical predictions. Finally, we evaluate the bit-error-rate of a single hologram, and of multiple holograms stored within the film.

  16. Some limitations in applying classical EHD film thickness formulas to a high-speed bearing

    NASA Technical Reports Server (NTRS)

    Coy, J. J.; Zaretsky, E. V.

    1980-01-01

    Elastohydrodynamic film thickness was measured for a 20-mm ball bearing using the capacitance technique. The bearing was thrust loaded to 90, 448, and 778 N. The corresponding maximum stresses on the inner race were 1.28, 2.09, and 2.45 GPa. Test speeds ranged from 400 to 14,000 rpm. Film thickness measurements were taken with four different lubricants: (a) synthetic paraffinic, (b) synthetic paraffinic with additives, (c) neopentylpolyol (tetra) ester meeting MIL-L-23699A specifications, and (d) synthetic cycloaliphatic hydrocarbon traction fluid. The test bearing was mist lubricated. Test temperatures were 300, 338, and 393 K. The measured results were compared to theoretical predictions using the formulas of Grubin, Archard and Cowking, Dowson and Higginson, and Hamrock and Dowson. There was good agreement with theory at low dimensionless speed, but the film was much smaller than theory predicts at higher speeds. This was due to kinematic starvation and inlet shear heating effects.

  17. Analysis of variance on thickness and electrical conductivity measurements of carbon nanotube thin films

    NASA Astrophysics Data System (ADS)

    Li, Min-Yang; Yang, Mingchia; Vargas, Emily; Neff, Kyle; Vanli, Arda; Liang, Richard

    2016-09-01

    One of the major challenges towards controlling the transfer of electrical and mechanical properties of nanotubes into nanocomposites is the lack of adequate measurement systems to quantify the variations in bulk properties while the nanotubes were used as the reinforcement material. In this study, we conducted one-way analysis of variance (ANOVA) on thickness and conductivity measurements. By analyzing the data collected from both experienced and inexperienced operators, we found some operation details users might overlook that resulted in variations, since conductivity measurements of CNT thin films are very sensitive to thickness measurements. In addition, we demonstrated how issues in measurements damaged samples and limited the number of replications resulting in large variations in the electrical conductivity measurement results. Based on this study, we proposed a faster, more reliable approach to measure the thickness of CNT thin films that operators can follow to make these measurement processes less dependent on operator skills.

  18. Thickness of Residual Wetting Film in Liquid-Liquid Displacement in Capillary Channels

    NASA Astrophysics Data System (ADS)

    Beresnev, I. A.; Gaul, W.; Vigil, D.

    2010-12-01

    Core-annular flow is common in nature, representing, for example, how streams of oil, surrounded by water, move in petroleum reservoirs. Oil, typically a non-wetting fluid, tends to occupy the middle (core) part of a channel, while water forms a surrounding wall-wetting film. What is the thickness of this wetting film? Understanding this question may determine the ultimate oil recovery. A classic theory has been in existence for nearly 50 years offering a solution, although in a controversial manner, for moving gas bubbles. On the other hand, an acceptable, experimentally verified theory for a body of one liquid flowing in another has not been available. We develop a hydrodynamic, testable theory providing an explicit relationship between the thickness of the wetting film and fluid properties for a blob of one fluid moving in another, with neither phase being gas. In its relationship to the capillary number Ca, the thickness of the film is predicted to be proportional to Ca2 at lower Ca and to level off at a constant value of about 20 % the channel radius at higher Ca. The thickness of the film is deduced to be approximately unaffected by the viscosity ratio of the fluids. We have conducted our own laboratory experiments and compiled experimental data from other studies, all of which are mutually consistent and confirm the salient features of the theory. At the same time, the classic law, originally deduced for films surrounding moving gas bubbles but often believed to hold for liquids as well, fails to explain the observations.

  19. On the Correlation of Specific Film Thickness and Gear Pitting Life

    NASA Technical Reports Server (NTRS)

    Krantz, Timothy L.

    2015-01-01

    The effect of the lubrication regime on gear performance has been recognized, qualitatively, for decades. Often the lubrication regime is characterized by the specific film thickness defined as the ratio of lubricant film thickness to the composite surface roughness. It can be difficult to combine results of studies to create a cohesive and comprehensive dataset. In this work gear surface fatigue lives for a wide range of specific film values were studied using tests done with common rigs, speeds, lubricant temperatures, and test procedures. This study includes previously reported data, results of an additional 50 tests, and detailed information from lab notes and tested gears. The dataset comprised 258 tests covering specific film values (0.47 to 5.2). The experimentally determined surface fatigue lives, quantified as 10-percent life estimates, ranged from 8.7 to 86.8 million cycles. The trend is one of increasing life for increasing specific film. The trend is nonlinear. The observed trends were found to be in good agreement with data and recommended practice for gears and bearings. The results obtained will perhaps allow for the specific film parameter to be used with more confidence and precision to assess gear surface fatigue for purpose of design, rating, and technology development.

  20. On the Correlation of Specific Film Thickness and Gear Pitting Life

    NASA Technical Reports Server (NTRS)

    Krantz, Timothy Lewis

    2014-01-01

    The effect of the lubrication regime on gear performance has been recognized, qualitatively, for decades. Often the lubrication regime is characterized by the specific film thickness defined as the ratio of lubricant film thickness to the composite surface roughness. It can be difficult to combine results of studies to create a cohesive and comprehensive dataset. In this work gear surface fatigue lives for a wide range of specific film values were studied using tests done with common rigs, speeds, lubricant temperatures, and test procedures. This study includes previously reported data, results of an additional 50 tests, and detailed information from lab notes and tested gears. The dataset comprised 258 tests covering specific film values [0.47 to 5.2]. The experimentally determined surface fatigue lives, quantified as 10-percent life estimates, ranged from 8.7 to 86.8 million cycles. The trend is one of increasing life for increasing specific film. The trend is nonlinear. The observed trends were found to be in good agreement with data and recommended practice for gears and bearings. The results obtained will perhaps allow for the specific film parameter to be used with more confidence and precision to assess gear surface fatigue for purpose of design, rating, and technology development.

  1. Deposition of controlled thickness ultrathin SnO2:Sb films by spin-coating.

    PubMed

    Giraldi, Tania R; Ribeiro, Cauê; Escote, Marcia T; Conti, Tiago G; Chiquito, Adenilson J; Leite, Edson R; Longo, Elson; Varela, José A

    2006-12-01

    The technological interest in transparent conductive oxide films (TCOs) has motivated several works in processing techniques, in order to obtain adequate routes to application. In this way, this work describes a new route to obtain antimony-doped tin oxide (ATO) films, based in colloidal dispersions of oxide nanocrystals. The nanoparticles were obtained by a hydrolisis method, using SnCl2 and SbCl3 in ethanolic solutions. The residual halides were removed by dyalisis, obtaining a limpid and transparent colloidal suspension. By this, the method offers the advantage of producing ultrathin films without organic contaminants. This route was employed to produce films with 5, 10, 14, and 18 mol% Sb doping, with thickness ranging from 40 to 70 nm. The physical characterization of the samples showed a uniform layer deposition, resulting in good packing density and high transmittance. A preliminar electrical study confirmed the low electrical resistivity even in the ultrathin films, in such level similar of reported data. The method described is similar in some aspects to layer-by-layer (LbL) techniques, allowing fine control of thickness and interesting properties for ultrathin films, however, with low cost when compared to similar routes.

  2. Charged magnetic domain walls as observed in nanostructured thin films: dependence on both film thickness and anisotropy.

    PubMed

    Favieres, C; Vergara, J; Madurga, V

    2013-02-13

    The magnetic domain configurations of soft magnetic, nanostructured, pulsed laser-deposited Co films were investigated. Their dependence on both the thickness t (20 nm ≤ t ≤ 200 nm) and the anisotropy was studied. Charged zigzag walls, with a characteristic saw-tooth vertex angle θ, were observed. θ changed with t from θ ≈ 17° to ≈25°, presenting an intermediate sharp maximum that has not been described before. The reduced length of the zigzag walls also exhibited a peak at t ≈ 70 nm. The relationship between the total reduced length and the density energy of the magnetic wall allowed us to establish a change from a Néel-type to a Bloch-type core of the zigzag walls at this thickness, t ≈ 70 nm. We also accounted for the magnetic energy arising from the surface roughness of the thinner films after imaging the film surface morphologies. Moreover, this distinctive behaviour of the zigzag walls of these low-anisotropy films was compared to that of high-anisotropy films.

  3. A computer solution for the dynamic load, lubricant film thickness, and surface temperatures in spiral-bevel gears

    NASA Technical Reports Server (NTRS)

    Chao, H. C.; Baxter, M.; Cheng, H. S.

    1983-01-01

    A computer method for determining the dynamic load between spiral bevel pinion and gear teeth contact along the path of contact is described. The dynamic load analysis governs both the surface temperature and film thickness. Computer methods for determining the surface temperature, and film thickness are presented along with results obtained for a pair of typical spiral bevel gears.

  4. Thickness-dependent photocatalytic performance of nanocrystalline TiO2 thin films prepared by sol-gel spin coating

    NASA Astrophysics Data System (ADS)

    Wu, Chung-Yi; Lee, Yuan-Ling; Lo, Yu-Shiu; Lin, Chen-Jui; Wu, Chien-Hou

    2013-09-01

    TiO2 nanocrystalline thin films on soda lime glass have been prepared by sol-gel spin coating. The thin films were characterized for surface morphology, crystal structure, chemical composition, thickness, and transparency by atomic force microscopy (AFM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), ellipsometry, and UV-vis spectrophotometry. The films prepared by titanium tetraisopropoxide (TTIP) as the precursor under pH of 3.5 ± 0.5 and with calcination temperature of 450 ̊C for 3 h exhibited superior homogeneous aggregation, good optical transparency, superhydrophilicity, and reliable thickness. The effect of film thickness on the photocatalytic degradation of acid yellow 17 was investigated under UV irradiation. The photocatalytic activity was strongly correlated with the number of coatings and followed Langmuir-type kinetics. Under the same film thickness, TiO2 thin films prepared by 0.1 M TTIP exhibited more efficient photocatalytic activity than those prepared by 0.3 M TTIP. For thin films prepared by 0.1 M TTIP, the maximum specific photocatalytic activity occurred at 5 coatings with thickness of 93 ± 1 nm. A model was proposed to rationalize the dependence of the film thickness on the photocatalytic activity, which predicts the existence of an optimum film thickness.

  5. Thickness Dependence of Characteristics for (Ba, Sr)TiO3 Thin Films Prepared by Metalorganic Chemical Vapor Deposition

    NASA Astrophysics Data System (ADS)

    Takeshima, Yutaka; Tanaka, Katsuhiko; Sakabe, Yukio

    2000-09-01

    (Ba0.6, Sr0.4)TiO3 thin films were prepared by metalorganic chemical vapor deposition (MOCVD) using bisdipvaloylmethanatobarium tetraethylenepentamine adduct (Ba(C11H19O2)2(C8H23N5)2), bisdipvaloylmethanatostrontium tetraethylenepentamine adduct (Sr(C11H19O2)2(C8H23N5)2), and titanium isopropoxide (Ti(i-OC3H7)4) as starting materials. The thickness dependence of permittivity and other characteristics were investigated for epitaxially grown barium strontium titanate (BST) thin films on Pt(100)/MgO(100) substrates and nonepitaxially grown BST films on Pt(111)/MgO(100) substrates. The epitaxially grown films had a high relative permittivity (1200) at thicknesses greater than 120 nm. Permittivity decreased with the film thickness when the thickness was less than 120 nm, but remained constant at thicknesses between 50 and 80 nm. The nonepitaxially grown films had a relative permittivity of 600 at a thickness greater than 100 nm and decreased with decreasing film thickness when the thickness was below 100 nm. In this paper, the origin of thickness dependence is discussed in terms of the grain-size effect and the strain effect.

  6. Fabrication and characterization of micromachined high-frequency tonpilz transducers derived by PZT thick films.

    PubMed

    Zhou, Qifa; Cannata, Jonathan M; Meyer, Richard J; van Tol, David J; Tadigadapa, Srinivas; Hughes, W Jack; Shung, K Kirk; Trolier-McKinstry, Susan

    2005-03-01

    Miniaturized tonpilz transducers are potentially useful for ultrasonic imaging in the 10 to 100 MHz frequency range due to their higher efficiency and output capabilities. In this work, 4 to 10-microm thick piezoelectric thin films were used as the active element in the construction of miniaturized tonpilz structures. The tonpilz stack consisted of silver/lead zirconate titanate (PZT)/lanthanum nickelate (LaNiO3)/silicon on insulator (SOI) substrates. First, conductive LaNiO3 thin films, approximately 300 nm in thickness, were grown on SOI substrates by a metalorganic decomposition (MOD) method. The room temperature resistivity of the LaNiO3 was 6.5 x 10(-6) omega x m. Randomly oriented PZT (52/48) films up to 7-microm thick were then deposited using a sol-gel process on the LaNiO3-coated SOI substrates. The PZT films with LaNiO3 bottom electrodes showed good dielectric and ferroelectric properties. The relative dielectric permittivity (at 1 kHz) was about 1030. The remanent polarization of PZT films was larger than 26 microC/cm2. The effective transverse piezoelectric e31,f coefficient of PZT thick films was about -6.5 C/m2 when poled at -75 kV/cm for 15 minutes at room temperature. Enhanced piezoelectric properties were obtained on poling the PZT films at higher temperatures. A silver layer about 40-microm thick was prepared by silver powder dispersed in epoxy and deposited onto the PZT film to form the tail mass of the tonpilz structure. The top layers of this wafer were subsequently diced with a saw, and the structure was bonded to a second wafer. The original silicon carrier wafer was polished and etched using a Xenon difluoride (XeF2) etching system. The resulting structures showed good piezoelectric activity. This process flow should enable integration of the piezoelectric elements with drive/receive electronics.

  7. Structural, morphological, electrical, and optical properties of silver thin films of varying thickness deposited on cupric oxide

    NASA Astrophysics Data System (ADS)

    Hajakbari, Fatemeh; Shafieinejad, Farzaneh

    2016-03-01

    In this investigation, silver (Ag) films of varying thickness (25-100 nm) were grown on cupric oxide (CuO) on silicon and quartz. The CuO preparation was carried out by the thermal oxidation annealing of copper (Cu) thin films deposited by DC magnetron sputtering. The physical properties of the prepared films were studied by different techniques. Rutherford backscattering spectroscopy (RBS) analysis indicated that the Ag film thickness was about 25-100 nm. X-ray diffraction (XRD) results showed that by increasing Ag thickness, the film crystallinity was improved. Also, atomic force microscopy (AFM) and scanning electron microscopy (SEM) results demonstrated that the surface morphology and the grain size were affected by the Ag film thickness. Furthermore, the electrical resistivity of films determined by four-point probe measurements versus the Ag film thickness was discussed. A reduction in the optical band gap energy of CuO is observed from 1.51 to 1.42 eV with an increase in Ag film thickness to 40 nm in Ag/CuO films.

  8. Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method

    NASA Astrophysics Data System (ADS)

    Gong, Junbo; Dai, Rucheng; Wang, Zhongping; Zhang, Zengming

    2015-03-01

    Effective optical constants of Ag thin films are precisely determined with effective thickness simultaneously by using an ellipsometry iterated with transmittance method. Unlike the bulk optical constants in Palik's database the effective optical constants of ultrathin Ag films are found to strongly depend on the thickness. According to the optical data two branches of thickness dispersion of surface plasmon energy are derived and agreed with theoretical predication. The thickness dispersion of bulk plasmon is also observed. The influence of substrate on surface plasmon is verified for the first time by using ellipsometry. The thickness dependent effective energy loss function is thus obtained based on this optical method for Ag ultrathin films. This method is also applicable to other ultrathin films and can be used to establish an effective optical database for ultrathin films.

  9. Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method

    PubMed Central

    Gong, Junbo; Dai, Rucheng; Wang, Zhongping; Zhang, Zengming

    2015-01-01

    Effective optical constants of Ag thin films are precisely determined with effective thickness simultaneously by using an ellipsometry iterated with transmittance method. Unlike the bulk optical constants in Palik's database the effective optical constants of ultrathin Ag films are found to strongly depend on the thickness. According to the optical data two branches of thickness dispersion of surface plasmon energy are derived and agreed with theoretical predication. The thickness dispersion of bulk plasmon is also observed. The influence of substrate on surface plasmon is verified for the first time by using ellipsometry. The thickness dependent effective energy loss function is thus obtained based on this optical method for Ag ultrathin films. This method is also applicable to other ultrathin films and can be used to establish an effective optical database for ultrathin films. PMID:25797217

  10. High-frequency permeability and permittivity of Ni xZn (1-x)Fe 2O 4 thick film

    NASA Astrophysics Data System (ADS)

    Kulkarni, D. C.; Lonkar, U. B.; Puri, Vijaya

    Magnetic materials such as Ni xZn (1-x)Fe 2O 4 have resonant frequency in high frequency; therefore, they are more useful especially in microwaves. The Ni xZn (1-x)Fe 2O 4 was prepared by the chemical coprecipitation method using citrate precursors, and the fritless thick film was screen printed on alumina substrates. The composition-dependent permeability and permittivity in the high frequency 8-12 GHz are investigated. Using the overlay technique on Ag-thick-film patch antenna, the change in reflectance and transmittance has been measured. The Ni xZn (1-x)Fe 2O 4 thick film, when used as overlay on Ag-thick-film patch antenna, changes the resonance characteristics. The changes in resonance frequency, reflectance and transmittance have been used to calculate the permeability and permittivity of the thick film. Zinc-concentration-dependent changes are obtained.

  11. Quartz Microbalance Study of 400-angstrom Thick Films near the lambda Point

    NASA Technical Reports Server (NTRS)

    Chan, Moses H. W.

    2003-01-01

    In a recent measurement we observed the thinning of an adsorbed helium film induced by the confinement of critical fluctuations a few millikelvin below the lambda point. A capacitor set-up was used to measure this Casimir effect. In this poster we will present our measurement of an adsorbed helium film of 400 angstroms near the lambda point with a quartz microbalance. For films this thick, we must take into account the non-linear dynamics of the shear waves in the fluid. In spite of the added complications, we were able to confirm the thinning of the film due to the Casimir effect and the onset of the superfluid transition. In addition, we observe a sharp anomaly at the bulk lambda point, most likely related to critical dissipation of the first sound. This work is carried out in collaboration with Rafael Garcia, Stephen Jordon and John Lazzaretti. This work is funded by NASA's Office of Biological and Physical Research under grant.

  12. Thickness dependence of the surface plasmon dispersion in ultrathin aluminum films on silicon

    NASA Astrophysics Data System (ADS)

    Yu, Yinghui; Tang, Zhe; Jiang, Ying; Wu, Kehui; Wang, Enge

    2006-11-01

    The collective excitation in Al films deposited on Si(1 1 1)-7 × 7 surface was investigated by high-resolution electron-energy-loss spectroscopy (HREELS), X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM). At the Al film thickness d < 10 ML, the surface plasmon of Al film has only a small contribution to the observed energy-loss peaks in the long wavelength limit (q∥≈0), while its contribution becomes significant for q∥>d-1. More interestingly, for thin Al films, the initial slope of the surface plasmon dispersion curve is positive at q∥˜0, in a sharp contrast to bulk Al surface where the energy dispersion is negative. These observations may be explained based on the screening interaction of the space charge region at the Al-Si interface.

  13. Design of Highly Photofunctional Porous Polymer Films with Controlled Thickness and Prominent Microporosity

    PubMed Central

    Gu, Cheng; Huang, Ning; Wu, Yang; Xu, Hong; Jiang, Donglin

    2015-01-01

    Porous organic polymers allow the integration of various π-units into robust porous π-networks, but they are usually synthesized as unprocessable solids with poor light-emitting performance as a result of aggregation-related excitation dissipation. Herein, we report a general strategy for the synthesis of highly emissive photofunctional porous polymer films on the basis of a complementary scheme for the structural design of aggregation-induced-emissive π-systems. We developed a high-throughput and facile method for the direct synthesis of large-area porous thin films at the liquid–electrode interface. The approach enables the preparation of microporous films within only a few seconds or minutes and allows precise control over their thickness with sub-nanometer precision. By virtue of rapid photoinduced electron transfer, the thin films can detect explosives with enhanced sensitivity to low parts-per-million levels in a selective manner. PMID:26234636

  14. Alignment of muscle precursor cells on the vertical edges of thick carbon nanotube films.

    PubMed

    Holt, Ian; Gestmann, Ingo; Wright, Andrew C

    2013-10-01

    The development of scaffolds and templates is an essential aspect of tissue engineering. We show that thick (>0.5 mm) vertically aligned carbon nanotube films, made by chemical vapour deposition, can be used as biocompatible substrates for the directional alignment of mouse muscle cells where the cells grow on the exposed sides of the films. Ultra high resolution scanning electron microscopy reveals that the films themselves consist mostly of small diameter (10 nm) multi-wall carbon nanotubes of wavy morphology with some single wall carbon nanotubes. Our findings show that for this alignment to occur the nanotubes must be in pristine condition. Mechanical wiping of the films to create directional alignment is detrimental to directional bioactivity. Larger areas for study have been formed from a composite of multiply stacked narrow strips of nanotubes wipe-transferred onto elastomer supports. These composite substrates appear to show a useful degree of alignment of the cells.

  15. Thickness dependence of the preferred orientation of Mn-Zn ferrite thin films deposited by ion-beam sputtering

    NASA Astrophysics Data System (ADS)

    Cho, Hae Seok; Kim, Hyeong Joon

    1995-07-01

    The thickness dependence of the preferred orientation of the Cu or Ti added Mn-Zn ferrite thin films deposited on SiO2(1000 Å)/Si(100) at 350 °C by ion-beam sputtering was investigated. A mosaic target, consisting of a single-crystal (110) Mn-Zn ferrite with a metal strip on it, was employed as the target. The (hhh) preferred orientation, formed at the initial growth stage, of the Cu added Mn-Zn ferrite film changed to the (h00) preferred orientation with increasing film thickness, while the initially formed (h00) preferred orientation of the Ti added one was enhanced with increasing film thickness. Such different behaviors were discussed in terms of the surface energy and the preferred growth orientation of the ferrite film. The thickness dependence of magnetic properties of the ferrite films was also investigated.

  16. Composition Shift as a Function of Thickness in Fe3-δO4(001) Epitaxial Films

    NASA Astrophysics Data System (ADS)

    Minagawa, Makoto; Yanagihara, Hideto; Uwabo, Kazuyuki; Kita, Eiji; Mibu, Ko

    2010-08-01

    We report on a thickness-dependent composition shift and a valency change in B-site Fe in Fe3-δO4(001) epitaxial films prepared by ozone-assisted molecular beam epitaxy. Conversion electron Mössbauer spectroscopy (CEMS) measurements for locally inserted 57Fe-enriched probe layers showed that a pure γ-Fe2O3 film can be obtained only if the film is sufficiently thin, and that the composition shift occurs when the thickness increases. The resistivity of Fe3-δO4 films having different thicknesses exhibited a significant decrease with an increase in the thickness, consistent with the CEMS experiment. These results indicate that γ-Fe2O3 films do not preferably grow homoepitaxially and that careful control of the growth is necessary to apply γ-Fe2O3 films to spintronics devices.

  17. Study on the measurement of thin film thickness with fringe scanning method

    NASA Astrophysics Data System (ADS)

    Su, Jun-hong; Shi, Ying; Liu, Bing-cai

    2012-10-01

    Optical interferometry is a proven high-precision measurement technology, this paper collect interference fringe pattern of the measured film with phase-shift and shear principle based on optical interferometry and digital image processing, obtain multiple interferogram through control phase shifter in the same step to strike the average phase value,then achieve thin film thickness measurement. The kernel of this technology is to obtain necessary phase parameter by processing interferogram with reasonable algorithm and software. Preprocessing the collected image, including noise elimination, skew correction and contrast enhancement to get clear interference fringe pattern, and strike the main phase value through phase shift algorithm. Phase unwrapping the interferogram as for the distribution in a rang of (-π,π) to restore a continuous wave front phase, get surface shape distribution and thickness information of the thin film. The results show that this method of measuring film thickness is not only having high processing precision, but also having the advantages of non-contact measurement.

  18. Thickness-dependent quantum oscillations in Cd3As2 thin films

    NASA Astrophysics Data System (ADS)

    Cheng, Peihong; Zhang, Cheng; Liu, Yanwen; Yuan, Xiang; Song, Fengqi; Sun, Qingqing; Zhou, Peng; Zhang, David Wei; Xiu, Faxian

    2016-08-01

    Cd3As2 is a new kind of three-dimensional (3D) Dirac semimetal with extraordinary carrier mobility, which can be viewed as ‘3D graphene’. Theory predicts that Cd3As2 can be driven into a quantum spin Hall insulator with a sizeable band gap by reducing dimensionality. In this letter, we report the systematic growth of undoped Cd3As2 thin films with the thickness of 50 ˜ 900 nm by molecular beam epitaxy. The magneto-transport study on these single-crystalline films shows a high mobility in the range of 3.8 ˜ 9.1 × 103 cm2 · V-1 · s-1 and a relative low electron concentration of 1 ˜ 8 × 1017 cm-3. Significantly, a thickness-induced semimetal-to-semiconductor transition was observed. In contrast with what is expected in the bulk counterpart, the 50 nm-thick Cd3As2 film exhibits semiconducting characteristics, witnessing an emerged bandgap opening when the dimensionality is reduced. Finally, the analyses on the temperature- and angular-dependence of magneto-resistance and Shubnikov-de Hass oscillations reveal a non-trivial to trivial Berry’s phase transition that is in connection with the reduced dimensionality. Our results demonstrate that the Cd3As2 thin films with unique electronic structure and high mobility hold promise for Dirac semimetal device applications.

  19. Thin and Thick Films Materials Based Interconnection Technology for 500 C Operation

    NASA Technical Reports Server (NTRS)

    Chen, Liang-Yu; Hunter, Gary W.; Neudeck, Philip G.

    2000-01-01

    Precious metal based thick-film material was used for printed wires, wire bond pads, test lead-attach, and conductive die-attach for high temperature (up to 500 C and beyond) chip level packaging. A SiC Shottky diode with a thin-film coated backside was attached to a ceramic substrate using precious metal based thick-film material as the electrically conductive bonding layer. After a 500-hour soak test in atmospheric oxygen, these basic interconnection elements, including attached test diode survived both electrically and mechanically. The electrical resistance of these interconnections (including thick-film printed wire/pad, bonded wire, and test lead attach) were low and stable at both room and elevated temperatures. The electrical resistance of the die-attach interface estimated by I-V characterization of the attached diode, during and after high temperature heat treatment, remained desirably low over the course of a 500-hour anneal. Further durability testing of this high temperature interconnection technology is also discussed.

  20. New method of synthesis and physical properties of thick superconducting Er-123 films

    NASA Astrophysics Data System (ADS)

    Muralidhar, M.; Sakai, N.; Machi, T.; Miyajiri, T.; Hirabayashi, I.; Tanaka, S.

    2008-09-01

    We have developed a low-cost, short time manufacturing process using a novel method, starting from a mixture of Er 2BaO 4, BaCuO 2, and CuO, with an excess of Er at expense of Ba. Several micrometers thick films were prepared by the screen-printing technique, spreading the mixture paste on silver substrates, processed then in Ar-1% O 2 atmosphere. Using a double-step annealing process, we obtained good quality Er-123 thick films on silver substrates, with Tc (onset) 92 K. Formation of large flat grains was observed by scanning electron microscope. According to XRD analysis, the films were preferentially c-axis oriented. The magnetic (induced), self-field Jc measured at 77 K was above 32 kA/cm 2. We observed a strong dependence of the transport current, Ic, on the grain size. The maximum Ic at 77 K as high as 10 A was observed in the sample with the average grain size around 40 μm. The present results indicate that our technology, enabling preparation of large-area superconducting thick films on Ag-based substrates in short processing times, is relatively cheap and appropriate for utilization in long-length RE-123 silver sheath wire production for commercial applications.

  1. Thickness-dependent nanofriction of a rare gas monolayer sliding on Pb(111) ultrathin films

    NASA Astrophysics Data System (ADS)

    Cai, X. L.; Wang, J. J.; Fu, X. N.; Bai, S. Y.; Niu, C. Y.; Jia, Y.

    2016-02-01

    The friction can be affected dramatically by quantum size effects (QSEs) and edge effects at nanoscale. The modulations of QSEs on nanofriction of a rare gas (RG) monolayer sliding on Pb(111) ultrathin films were investigated by using the first-principles approach within density functional theory (DFT) with van der Waals (vdW) interaction correction. Our findings revealed that there exist even-odd oscillations in the friction with the thickness of Pb(111) substrate and the friction can be tuned up to 30% by the different thicknesses of Pb(111) films. Moreover, such modulation is more obvious for the RG adatoms with larger radius. The underlying physics is that the oscillations of the electronic density of states at Fermi level induce different interactions and energy barriers between RG and Pb(111) films with different thicknesses. Overall, we here propose an approach to tune friction and a way to identify the electronic contribution to friction via the different thicknesses of substrates at nanoscale.

  2. Thick lead-free ferroelectric films with high Curie temperatures through nanocomposite-induced strain.

    PubMed

    Harrington, Sophie A; Zhai, Junyi; Denev, Sava; Gopalan, Venkatraman; Wang, Haiyan; Bi, Zhenxing; Redfern, Simon A T; Baek, Seung-Hyub; Bark, Chung W; Eom, Chang-Beom; Jia, Quanxi; Vickers, Mary E; Macmanus-Driscoll, Judith L

    2011-07-03

    Ferroelectric materials are used in applications ranging from energy harvesting to high-power electronic transducers. However, industry-standard ferroelectric materials contain lead, which is toxic and environmentally unfriendly. The preferred alternative, BaTiO(3), is non-toxic and has excellent ferroelectric properties, but its Curie temperature of ∼130 °C is too low to be practical. Strain has been used to enhance the Curie temperature of BaTiO(3) (ref. 4) and SrTiO(3) (ref. 5) films, but only for thicknesses of tens of nanometres, which is not thick enough for many device applications. Here, we increase the Curie temperature of micrometre-thick films of BaTiO(3) to at least 330 °C, and the tetragonal-to-cubic structural transition temperature to beyond 800 °C, by interspersing stiff, self-assembled vertical columns of Sm(2)O(3) throughout the film thickness. The columns, which are 10 nm in diameter, strain the BaTiO(3) matrix by 2.35%, forcing it to maintain its tetragonal structure and resulting in the highest BaTiO(3) transition temperatures so far.

  3. Thick lead-free ferroelectric films with high Curie temperatures through nanocomposite-induced strain

    NASA Astrophysics Data System (ADS)

    Harrington, Sophie A.; Zhai, Junyi; Denev, Sava; Gopalan, Venkatraman; Wang, Haiyan; Bi, Zhenxing; Redfern, Simon A. T.; Baek, Seung-Hyub; Bark, Chung W.; Eom, Chang-Beom; Jia, Quanxi; Vickers, Mary E.; MacManus-Driscoll, Judith L.

    2011-08-01

    Ferroelectric materials are used in applications ranging from energy harvesting to high-power electronic transducers. However, industry-standard ferroelectric materials contain lead, which is toxic and environmentally unfriendly. The preferred alternative, BaTiO3, is non-toxic and has excellent ferroelectric properties, but its Curie temperature of ~130 °C is too low to be practical. Strain has been used to enhance the Curie temperature of BaTiO3 (ref. 4) and SrTiO3 (ref. 5) films, but only for thicknesses of tens of nanometres, which is not thick enough for many device applications. Here, we increase the Curie temperature of micrometre-thick films of BaTiO3 to at least 330 °C, and the tetragonal-to-cubic structural transition temperature to beyond 800 °C, by interspersing stiff, self-assembled vertical columns of Sm2O3 throughout the film thickness. The columns, which are 10 nm in diameter, strain the BaTiO3 matrix by 2.35%, forcing it to maintain its tetragonal structure and resulting in the highest BaTiO3 transition temperatures so far.

  4. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution

    NASA Astrophysics Data System (ADS)

    Vodák, J.; Nečas, D.; Ohlídal, M.; Ohlídal, I.

    2017-02-01

    In this paper an imaging spectroscopic reflectometer with enhanced spatial resolution is presented. Main features of its design, experimental data acquisition, i.e. maps of thin film spectral dependencies of local reflectance and the local thickness map determination are described. The ability of this instrument to characterize thin film thickness non-uniformity with high gradients is demonstrated on measurements of thin film edges. A comparison with an older device is also presented.

  5. Perfect light trapping in nanoscale thickness semiconductor films with a resonant back reflector and spectrum-splitting structures.

    PubMed

    Liu, Jiang-Tao; Deng, Xin-Hua; Yang, Wen; Li, Jun

    2015-02-07

    The optical absorption of nanoscale thickness semiconductor films on top of light-trapping structures based on optical interference effects combined with spectrum-splitting structures is theoretically investigated. Nearly perfect absorption over a broad spectrum range can be achieved in <100 nm thick films on top of a one-dimensional photonic crystal or metal films. This phenomenon can be attributed to interference induced photonic localization, which enhances the absorption and reduces the reflection of the films. Perfect solar absorption and low carrier thermalization loss can be achieved when the light-trapping structures with a wedge-shaped spacer layer or semiconductor films are combined with spectrum-splitting structures.

  6. Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

    NASA Astrophysics Data System (ADS)

    Nakagawa, K.; Nakayama, S.; Saito, A.; Ono, S.; Kai, H.; Mukaida, M.; Honma, T.; Ohshima, S.

    2010-11-01

    We investigated the relationship between the intrinsic surface resistance (Rsint) and critical current density (Jc) of YBa2Cu3Oy (YBCO) film thinner than the penetration depth (λL). The measured YBCO films were deposited on CeO2-buffered r-cut Al2O3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100 nm, respectively. The Rsint means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance (Rseff) including the impedance of the substrate and the Jc of each YBCO film were measured using the dielectric resonator method at 21.8 GHz and the inductive method. We calculated Rsint by using phenomenological expressions and the Rseff value. The Rsint values of each YBCO film were almost the same in the measured temperature region. As a result, we found that Rsint was in inverse proportion to the Jc of YBCO film thinner than λL.

  7. Thick barium hexaferrite (Ba-M) films prepared by electron-beam evaporation for microwave application

    NASA Astrophysics Data System (ADS)

    Wane, I.; Bessaudou, A.; Cosset, F.; Célérier, A.; Girault, C.; Decossas, J. L.; Vareille, J. C.

    2000-03-01

    Hexagonal ferrites such as barium or strontium hexaferrites have many existing and potential applications. Among these are microwave devices. In this paper we present the results of Ba-M thick ferrite films deposited on silicon (1 0 0) by electron-beam evaporation. To increase adhesion and reduce cracks, the films are also deposited on thin (#1 μm) metallic underlayers. The influence of deposition rate and post-deposition annealing on crystallographic structure, magnetic properties, morphology and chemical composition has been investigated. The deposition pressure was equal to 0.46 Pa and substrate temperature was kept at 200°C. The results show that, before annealing, the films do not crystallise under the bulk phase of BaFe 12O 19 (Ba-M) and magnetic measurements show no hysteresis curve. On the other hand, films annealed at 850°C for 2 h in oxygen atmosphere are magnetic and crystallise in the Ba-M phase. The coercive fields of these films range between 160 and 360 kA/m. The saturation magnetisation of the annealed films varies between 0.15 and 0.21 T. The EDX analysis shows that the Fe/Ba atomic ratio depends on the deposition rate. The SEM study shows homogeneous film surfaces and small grains size.

  8. (Hg, Sb)Ba2Ca2Cu3O8+δ thick films on YSZ substrates

    NASA Astrophysics Data System (ADS)

    Li, J. Q.; Lam, C. C.; Peacock, G. B.; Hyatt, N. C.; Gameson, I.; Edwards, P. P.; Shields, T. C.; Abell, J. S.

    2000-02-01

    Superconducting thick films of (Hg, Sb)Ba2Ca2Cu3O8+icons/Journals/Common/delta" ALT="delta" ALIGN="MIDDLE"/> have been fabricated on polycrystalline yttria-stabilized-zirconia substrates utilizing an Hg-free precursor film reacted with Hg vapour, released from a solid Hg source, in a sealed quartz tube. The resulting films have been studied by x-ray diffraction, scanning electron microscopy, ac susceptibility and resistance measurement techniques. A high quality Hg(Sb)-1223 superconducting thick film on YSZ can be fabricated by using a pre-melted Hg-free precursor film. The zero resistance superconducting transition temperature in the post-growth oxygenated thick film is in excess of 130 K and the transport critical current density for the film is 510 A cm-2 at 77 K.

  9. Orientation and thickness dependence of magnetization at the interfacesof highly spin-polarized manganite thin films

    SciTech Connect

    Chopdekar, Rajesh V.; Arenholz, Elke; Suzuki, Y.

    2008-08-18

    We have probed the nature of magnetism at the surface of (001), (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3} thin films. The spin polarization of La{sub 0.7}Sr{sub 0.3}MnO{sub 3} thin films is not intrinsically suppressed at all surfaces and interfaces but is highly sensitive to both the epitaxial strain state as well as the substrate orientation. Through the use of soft x-ray spectroscopy, the magnetic properties of (001), (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interfaces have been investigated and compared to bulk magnetometry and resistivity measurements. The magnetization of (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interfaces are more bulk-like as a function of thickness whereas the magnetization at the (001)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interface is suppressed significantly below a layer thickness of 20 nm. Such findings are correlated with the biaxial strain state of the La{sub 0.7}Sr{sub 0.3}MnO{sub 3} films; for a given film thickness it is the tetragonal distortion of (001) La{sub 0.7}Sr{sub 0.3}MnO{sub 3} that severely impacts the magnetization, whereas the trigonal distortion for (111)-oriented films and monoclinic distortion for (110)-oriented films have less of an impact. These observations provide evidence that surface magnetization and thus spin polarization depends strongly on the crystal surface orientation as well as epitaxial strain.

  10. Thickness, stability and contact angle of liquid films on and inside nanofibres, nanotubes and nanochannels.

    PubMed

    Mattia, Davide; Starov, Victor; Semenov, Sergey

    2012-10-15

    While the stability of liquid films on substrates is a classical topic of colloidal science, the availability of nanostructured materials, such as nanotubes, nanofibres and nanochannels, has raised the question of how the stability of liquid films and their wetting behaviour is affected by nanoscale confinement. This paper will present the conditions for the stability of liquid films on and inside cylindrical solid substrates with nanometre scale characteristic dimensions. It is shown that the stability is determined by an effective disjoining/conjoining pressure isotherm which differs from the corresponding disjoining/conjoining pressure isotherm of flat liquid films on flat solid substrates. From the former, the equilibrium contact angles of drops on an outer or inner surface of a cylindrical capillary have been calculated as a function of surface curvature, showing that the expressions for equilibrium contact angles vary for different geometries, in view of the difference in thickness of the film of uniform thickness with which the bulk liquid (drops or menisci) is at equilibrium. These calculations have been extended to the case of glass nanocapillaries and carbon nanotubes, finding good agreement with experimental results in the literature.

  11. Dissociative electron attachment in nanoscale ice films: Thickness and charge trapping effects

    SciTech Connect

    Simpson, W.C.; Orlando, T.M.

    1998-03-01

    The yield and kinetic energy (KE) distributions of D{sup {minus}} ions produced via dissociative electron attachment (DEA) resonances in nanoscale D{sub 2}O ice films are collected as a function of film thickness. The {sup 2}B{sub 1}, {sup 2}A{sub 1}, and {sup 2}B{sub 2} DEA resonances shift to higher energies and their D{sup {minus}} ion yields first increase and then decrease as the D{sub 2}O films thicken. The D{sup {minus}} KE distributions also shift to higher energy with increasing film thickness. We interpret the changes in the DEA yield and the D{sup {minus}} KE distributions in terms of modifications in the electronic and geometric structure of the surface of the film as it thickens. A small amount of charge build-up occurs following prolonged electron beam exposure at certain energies, which primarily affects the D{sup {minus}} KE distributions. Charge trapping measurements indicate that an enhancement in the trapping cross section occurs at energies near zero and between 6 and 10 eV. {copyright} {ital 1998 American Institute of Physics.}

  12. Dielectric and Piezoelectric Properties of PZT Composite Thick Films with Variable Solution to Powder Ratios

    PubMed Central

    Wu, Dawei; Zhou, Qifa; Shung, Koping Kirk.; Bharadwaja, Srowthi N.; Zhang, Dongshe; Zheng, Haixing

    2010-01-01

    The use of PZT films in sliver-mode high-frequency ultrasonic transducers applications requires thick, dense, and crack-free films with excellent piezoelectric and dielectric properties. In this work, PZT composite solutions were used to deposit PZT films >10 μm in thickness. It was found that the functional properties depend strongly on the mass ratio of PZT sol–gel solution to PZT powder in the composite solution. Both the remanent polarization, Pr, and transverse piezoelectric coefficient, e31,f, increase with increasing proportion of the sol–gel solution in the precursor. Films prepared using a solution-to-powder mass ratio of 0.5 have a remanent polarization of 8 μC/cm2, a dielectric constant of 450 (at 1 kHz), and e31,f = −2.8 C/m2. Increasing the solution-to-powder mass ratio to 6, the films were found to have remanent polarizations as large as 37 μC/cm2, a dielectric constant of 1250 (at 1 kHz) and e31,f = −5.8 C/m2. PMID:20376196

  13. Structure, conductivity, and transparency of Ga-doped ZnO thin films arising from thickness contributions

    SciTech Connect

    Liang Shuang; Bi Xiaofang

    2008-12-01

    Ga-doped ZnO (GZO) films were deposited on amorphous glass substrates at room temperature by radio frequency magnetron sputtering. It is revealed that the influence of deposition parameters, such as target-substrate distance and deposition time, on the structure and properties of the films arises primarily from the variations in film thickness. For the GZO films with smaller thicknesses ({<=}385 nm), crystallinity is greatly improved with an increase in thickness, which leads to an increase in Hall mobility and a decrease in electrical resistivity. The carrier concentration is, however, found to exhibit only a slight change with the thickness variations. The relationship of electrical property and microstructure suggests that the resistivity of the films arises mainly from ionic impurity scattering rather than from grain boundary scattering. All the films exhibit a transmittance of over 90% in the visible wavelength range. The band gap of the GZO films is widened with increasing film thickness. In combination with the result that the carrier concentration exhibited a slight dependence on thicknesses, the broadening of the band gap with thicknesses is attributed more to the improved crystallinity than to the Moss-Burstein shift.

  14. Effect of sputtered lanthanum hexaboride film thickness on field emission from metallic knife edge cathodes

    SciTech Connect

    Kirley, M. P.; Novakovic, B.; Sule, N.; Weber, M. J.; Knezevic, I.; Booske, J. H.

    2012-03-15

    We report experiments and analysis of field emission from metallic knife-edge cathodes, which are sputter-coated with thin films of lanthanum hexaboride (LaB{sub 6}), a low-work function material. The emission current is found to depend sensitively on the thickness of the LaB{sub 6} layer. We find that films thinner than 10 nm greatly enhance the emitted current. However, cathodes coated with a thicker layer of LaB{sub 6} are observed to emit less current than the uncoated metallic cathode. This result is unexpected due to the higher work function of the bare metal cathode. We show, based on numerical calculation of the electrostatic potential throughout the structure, that the external (LaB{sub 6}/vacuum) barrier is reduced with respect to uncoated samples for both thin and thick coatings. However, this behavior is not exhibited at the internal (metal/LaB{sub 6}) barrier. In thinly coated samples, electrons tunnel efficiently through both the internal and external barrier, resulting in current enhancement with respect to the uncoated case. In contrast, the thick internal barrier in thickly coated samples suppresses current below the value for uncoated samples in spite of the lowered external barrier. We argue that this coating thickness variation stems from a relatively low (no higher than 10{sup 18} cm{sup -3}) free carrier density in the sputtered polycrystalline LaB{sub 6}.

  15. Negative dependence of surface magnetocrystalline anisotropy energy on film thickness in Co33Fe67 alloy

    NASA Astrophysics Data System (ADS)

    Wang, De-Lai; Cui, Ming-Qi; Yang, Dong-Liang; Dong, Jun-Cai; Xu, Wei

    2016-10-01

    In this work, the magnetocrystalline anisotropy energy (MAE) on the surface of Fe33Co67 alloy film is extracted from x-ray magnetic linear dichroism (XMLD) experiments. The result indicates that the surface MAE value is negatively correlated with thickness. Through spectrum calculations and analysis, we find that besides the thickness effect, another principal possible cause may be the shape anisotropy resulting from the presence of interface roughness. These two factors lead to different electron structures on the fermi surface with different exchange fields, which produces different spin-orbit interaction anisotropies. Project supported by the National Natural Science Foundation of China (Grant Nos. 11075176 and 11375131).

  16. Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness

    DOE PAGES

    Bobbitt, Jonathan M.; Mendivelso-Pérez, Deyny; Smith, Emily A.

    2016-11-03

    A scanning angle (SA) Raman spectroscopy method was developed to simultaneously measure the chemical composition and thickness of waveguide mixed polymer films with varying fractional compositions. In order to test the method, six films of polystyrene-block-poly(methyl methacrylate), some mixed with poly(methyl methacrylate) homopolymer (PS-b-PMMA:PMMA), and two films of poly(2-vinylnapthalene)-block-poly(methyl methacrylate) (P2VN-b-PMMA) were prepared. The film thickness ranged from 495 to 971 nm. The chemical composition and thickness of PS-b-PMMA:PMMA films was varied by the addition of the PMMA homopolymer and annealing the films in toluene. SA Raman peak amplitude ratios (1001 cm-1 for PS, 812 cm-1 for PMMA, and 1388more » cm-1 for P2VN) were used to calculate the refractive index of the polymer film, an input parameter in calculations of the sum square electric field (SSEF). The film thickness was determined by SSEF models of the experimental Raman amplitudes versus the incident angle of light. The average film thickness determined by the developed SA Raman spectroscopy method was within 5% of the value determined by optical profilometry. In conclusion, SA Raman spectroscopy will be useful for in situ label-free analyses of mixed polymer waveguide films.« less

  17. Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness

    SciTech Connect

    Bobbitt, Jonathan M.; Mendivelso-Pérez, Deyny; Smith, Emily A.

    2016-11-03

    A scanning angle (SA) Raman spectroscopy method was developed to simultaneously measure the chemical composition and thickness of waveguide mixed polymer films with varying fractional compositions. In order to test the method, six films of polystyrene-block-poly(methyl methacrylate), some mixed with poly(methyl methacrylate) homopolymer (PS-b-PMMA:PMMA), and two films of poly(2-vinylnapthalene)-block-poly(methyl methacrylate) (P2VN-b-PMMA) were prepared. The film thickness ranged from 495 to 971 nm. The chemical composition and thickness of PS-b-PMMA:PMMA films was varied by the addition of the PMMA homopolymer and annealing the films in toluene. SA Raman peak amplitude ratios (1001 cm-1 for PS, 812 cm-1 for PMMA, and 1388 cm-1 for P2VN) were used to calculate the refractive index of the polymer film, an input parameter in calculations of the sum square electric field (SSEF). The film thickness was determined by SSEF models of the experimental Raman amplitudes versus the incident angle of light. The average film thickness determined by the developed SA Raman spectroscopy method was within 5% of the value determined by optical profilometry. In conclusion, SA Raman spectroscopy will be useful for in situ label-free analyses of mixed polymer waveguide films.

  18. EUV reflectometry for thickness and density determination of thin film coatings

    NASA Astrophysics Data System (ADS)

    Döring, S.; Hertlein, F.; Bayer, A.; Mann, K.

    2012-06-01

    An EUV reflectometer for the analysis of surfaces and thin films regarding refractive index, surface roughness, and mass density at the wavelength of 12.98 nm was developed. The setup uses a laser produced plasma source with an oxygen gas puff target for the generation of narrow-band EUV radiation and a flexible Kirkpatrick-Baez optics for focusing. We present EUV reflectometry (EUVR) measurements conducted on a series of carbon thin films to determine thickness and mass density of the coatings. In case of the thickness measurements results are compared to data obtained from nondestructive standard methods, i.e., grazing incidence X-ray reflectometry and spectroscopic ellipsometry. In addition, we propose a method to deduce the mass density of a sample directly from the fitted index of refraction obtained from EUVR measurements.

  19. Correlation of elastohydrodynamic film thickness measurements for fluorocarbon type 2 ester, and polyphenyl ether lubricants

    NASA Technical Reports Server (NTRS)

    Loewenthal, S. H.; Parker, R. J.; Zaretsky, E. V.

    1974-01-01

    A minimum films thickness correlation applicable to heavily loaded elastohydrodynamic (EHD) contacts was formulated from experimental data obtained by an X-ray transmission technique. The correlation, based on data generated with fluorocarbon, type II ester, and polyphenyl ether lubricants, extends a previous analysis developed from data for a synthetic paraffinic oil. The resulting correlation represents the data of the four lubricants reasonably well over a large range of operating conditions. Contained within the derived relation is a factor to account for the high-load dependence displayed by the measurements beyond that which is provided for by the theory. Thermal corrections applied to a commonly used film thickness formula showed little improvement to the general disagreement that exists between theory and test. Choice of contact geometry and material are judged to have a relatively mild influence on the form of the semiempirical model.

  20. Atmospheric pressure spatial atomic layer deposition web coating with in situ monitoring of film thickness

    SciTech Connect

    Yersak, Alexander S.; Lee, Yung C.; Spencer, Joseph A.; Groner, Markus D.

    2014-01-15

    Spectral reflectometry was implemented as a method for in situ thickness monitoring in a spatial atomic layer deposition (ALD) system. Al{sub 2}O{sub 3} films were grown on a moving polymer web substrate at 100 °C using an atmospheric pressure ALD web coating system, with film growth of 0.11–0.13 nm/cycle. The modular coating head design and the in situ monitoring allowed for the characterization and optimization of the trimethylaluminum and water precursor exposures, purge flows, and web speed. A thickness uniformity of ±2% was achieved across the web. ALD cycle times as low as 76 ms were demonstrated with a web speed of 1 m/s and a vertical gap height of 0.5 mm. This atmospheric pressure ALD system with in situ process control demonstrates the feasibility of low-cost, high throughput roll-to-roll ALD.

  1. Oil film thickness measurement using airborne laser-induced water Raman backscatter

    NASA Technical Reports Server (NTRS)

    Hoge, F. E.; Swift, R. N.

    1980-01-01

    The use of laser-induced water Raman backscatter for remote thin oil film detection and thickness measurement is reported here for the first time. A 337.1-nm nitrogen laser was used to excite the 3400-cm-1 OH stretch band of natural ocean water beneath the oil slick from an altitude of 150 m. The signal strength of the 381-nm water Raman backscatter was always observed to depress when the oil was encountered and then return to its original undepressed value after complete aircraft traversal of the floating slick. After removal of background and oil fluorescence contributions, the ratio of the depressed-to-undepressed airborne water Raman signal intensities, together with laboratory measured oil extinction coefficients, is used to calculate the oil film thickness.

  2. Long thickness-extensional waves in thin film bulk acoustic wave filters affected by interdigital electrodes.

    PubMed

    Liu, Jing; Du, Jianke; Wang, Ji; Yang, Jiashi

    2017-03-01

    We studied free vibrations of thin-film bulk acoustic wave filters with interdigital electrodes theoretically using the scalar differential equations by Tiersten and Stevens. The filters are made from AlN or ZnO films on Si substrates with ground and driving electrodes. They operate with thickness-extensional modes. The basic vibration characteristics including resonant frequencies and mode shapes were obtained. Their dependence on various geometric parameters was examined. It was found that for properly design filters there exist trapped modes whose vibrations are strong in regions with a driving electrode and decay away from the electrode edges. These trapped modes are essentially long plate thickness-extensional modes modulated by the electrode fingers. The number of trapped modes is sensitive to the geometric parameters.

  3. The effect of surface roughness on the average film thickness between lubricated rollers

    NASA Technical Reports Server (NTRS)

    Chow, L. S. H.; Cheng, H. S.

    1976-01-01

    The Christensen theory of stochastic models for hydrodynamic lubrication of rough surfaces is extended to elastohydrodynamic lubrication between two rollers. The Grubin-type equation including asperity effects in the inlet region is derived. Solutions for the reduced pressure at the entrance as a function of the ratio of the average nominal film thickness to the rms surface roughness (in terms of standard deviation), have been obtained numerically. Results were obtained for purely transverse and purely longitudinal surface roughness for cases with or without slip. The reduced pressure is shown to decrease slightly by considering longitudinal surface roughness. Transverse surface roughness has a slight beneficial effect on the average film thickness at the inlet. The same approach was used to study the effect of surface roughness on lubrication between rigid rollers and lubrication of an infinitely-wide slider bearing. The effects of surface roughness are shown to be similar to those found in elastohydrodynamic contacts.

  4. DETERMINATION OF LIQUID FILM THICKNESS FOLLOWING DRAINING OF CONTACTORS, VESSELS, AND PIPES IN THE MCU PROCESS

    SciTech Connect

    Poirier, M; Fernando Fondeur, F; Samuel Fink, S

    2006-06-06

    The Department of Energy (DOE) identified the caustic side solvent extraction (CSSX) process as the preferred technology to remove cesium from radioactive waste solutions at the Savannah River Site (SRS). As a result, Washington Savannah River Company (WSRC) began designing and building a Modular CSSX Unit (MCU) in the SRS tank farm to process liquid waste for an interim period until the Salt Waste Processing Facility (SWPF) begins operations. Both the solvent and the strip effluent streams could contain high concentrations of cesium which must be removed from the contactors, process tanks, and piping prior to performing contactor maintenance. When these vessels are drained, thin films or drops will remain on the equipment walls. Following draining, the vessels will be flushed with water and drained to remove the flush water. The draining reduces the cesium concentration in the vessels by reducing the volume of cesium-containing material. The flushing, and subsequent draining, reduces the cesium in the vessels by diluting the cesium that remains in the film or drops on the vessel walls. MCU personnel requested that Savannah River National Laboratory (SRNL) researchers conduct a literature search to identify models to calculate the thickness of the liquid films remaining in the contactors, process tanks, and piping following draining of salt solution, solvent, and strip solution. The conclusions from this work are: (1) The predicted film thickness of the strip effluent is 0.010 mm on vertical walls, 0.57 mm on horizontal walls and 0.081 mm in horizontal pipes. (2) The predicted film thickness of the salt solution is 0.015 mm on vertical walls, 0.74 mm on horizontal walls, and 0.106 mm in horizontal pipes. (3) The predicted film thickness of the solvent is 0.022 mm on vertical walls, 0.91 mm on horizontal walls, and 0.13 mm in horizontal pipes. (4) The calculated film volume following draining is: (a) Salt solution receipt tank--1.6 gallons; (b) Salt solution feed

  5. Characterization of Thick and Thin Film SiCN for Pressure Sensing at High Temperatures

    PubMed Central

    Leo, Alfin; Andronenko, Sergey; Stiharu, Ion; Bhat, Rama B.

    2010-01-01

    Pressure measurement in high temperature environments is important in many applications to provide valuable information for performance studies. Information on pressure patterns is highly desirable for improving performance, condition monitoring and accurate prediction of the remaining life of systems that operate in extremely high temperature environments, such as gas turbine engines. A number of technologies have been recently investigated, however these technologies target specific applications and they are limited by the maximum operating temperature. Thick and thin films of SiCN can withstand high temperatures. SiCN is a polymer-derived ceramic with liquid phase polymer as its starting material. This provides the advantage that it can be molded to any shape. CERASET™ also yields itself for photolithography, with the addition of photo initiator 2, 2-Dimethoxy-2-phenyl-acetophenone (DMPA), thereby enabling photolithographical patterning of the pre-ceramic polymer using UV lithography. SiCN fabrication includes thermosetting, crosslinking and pyrolysis. The technology is still under investigation for stability and improved performance. This work presents the preparation of SiCN films to be used as the body of a sensor for pressure measurements in high temperature environments. The sensor employs the phenomenon of drag effect. The pressure sensor consists of a slender sensitive element and a thick blocking element. The dimensions and thickness of the films depend on the intended application of the sensors. Fabrication methods of SiCN ceramics both as thin (about 40–60 μm) and thick (about 2–3 mm) films for high temperature applications are discussed. In addition, the influence of thermosetting and annealing processes on mechanical properties is investigated. PMID:22205871

  6. Thickness dependence of piezoelectric properties of BiFeO3 films fabricated using rf magnetron sputtering system

    NASA Astrophysics Data System (ADS)

    Aramaki, Masaaki; Kariya, Kento; Yoshimura, Takeshi; Murakami, Shuichi; Fujimura, Norifumi

    2016-10-01

    The piezoelectric property of BiFeO3 films prepared on a (100) LaNiO3/Si(100) substrate using an rf magnetron sputtering system was investigated for their applications in MEMS vibration energy harvesters. The X-ray diffraction profiles indicate that (100)-oriented BiFeO3 films with thicknesses from 450 to 1750 nm were obtained at a deposition temperature of 510 °C. All the films showed well-defined ferroelectric hysteresis loops at room temperature. The thickness dependence of crystallinity and electrical properties indicated that the films have a bottom layer with a high defect density. The e 31,f piezoelectric coefficient and electromechanical coupling factor (k\\text{31,f}2) increase with increasing film thickness and reach -3.2 C/m2 and 3.3%, respectively, at a thickness of 1750 nm, which is considered to be caused by the decrease in defect density.

  7. Critical thickness and strain relaxation in molecular beam epitaxy-grown SrTiO3 films

    NASA Astrophysics Data System (ADS)

    Wang, Tianqi; Ganguly, Koustav; Marshall, Patrick; Xu, Peng; Jalan, Bharat

    2013-11-01

    We report on the study of the critical thickness and the strain relaxation in epitaxial SrTiO3 film grown on (La0.3Sr0.7)(Al0.65Ta0.35)O3 (001) (LSAT) substrate using the hybrid molecular beam epitaxy approach. No change in the film's lattice parameter (both the in-plane and the out-of-plane) was observed up to a film thickness of 180 nm, which is in sharp contrast to the theoretical critical thickness of ˜12 nm calculated using the equilibrium theory of strain relaxation. For film thicknesses greater than 180 nm, the out-of-plane lattice parameter was found to decrease hyperbolically in an excellent agreement with the relaxation via forming misfit dislocations. Possible mechanisms are discussed by which the elastic strain energy can be accommodated prior to forming misfit dislocations leading to such anomalously large critical thickness.

  8. Efficient phase matching algorithm for measurements of ultrathin indium tin oxide film thickness in white light interferometry

    NASA Astrophysics Data System (ADS)

    Chen, Kai; Lei, Feng; Itoh, Masahide

    2017-02-01

    A novel method is proposed to measure the thickness of the indium tin oxide (ITO) film, which is less than 20 nm, using valid Fourier's phase information of white light correlogram and curve matching algorithm. Based on the Fourier transform amplitude information, the valid phase distribution function that contains the thin transparent electrode ITO film thickness information has been successfully extracted. A curve matching algorithm based on standard deviation is employed to accurately calculate the thickness of such thin ITO films. The experimental results show that the thickness values were consistent with that determined using the stylus instruments, indicating that this method can be applied to measure the ITO film thickness ranging from 5 to 100 nm.

  9. A reliable control system for measurement on film thickness in copper chemical mechanical planarization system

    NASA Astrophysics Data System (ADS)

    Li, Hongkai; Qu, Zilian; Zhao, Qian; Tian, Fangxin; Zhao, Dewen; Meng, Yonggang; Lu, Xinchun

    2013-12-01

    In recent years, a variety of film thickness measurement techniques for copper chemical mechanical planarization (CMP) are subsequently proposed. In this paper, the eddy-current technique is used. In the control system of the CMP tool developed in the State Key Laboratory of Tribology, there are in situ module and off-line module for measurement subsystem. The in situ module can get the thickness of copper film on wafer surface in real time, and accurately judge when the CMP process should stop. This is called end-point detection. The off-line module is used for multi-points measurement after CMP process, in order to know the thickness of remained copper film. The whole control system is structured with two levels, and the physical connection between the upper and the lower is achieved by the industrial Ethernet. The process flow includes calibration and measurement, and there are different algorithms for two modules. In the process of software development, C++ is chosen as the programming language, in combination with Qt OpenSource to design two modules' GUI and OPC technology to implement the communication between the two levels. In addition, the drawing function is developed relying on Matlab, enriching the software functions of the off-line module. The result shows that the control system is running stably after repeated tests and practical operations for a long time.

  10. The roles of buffer layer thickness on the properties of the ZnO epitaxial films

    NASA Astrophysics Data System (ADS)

    Tang, Kun; Huang, Shimin; Gu, Shulin; Zhu, Shunming; Ye, Jiandong; Xu, Zhonghua; Zheng, Youdou

    2016-12-01

    In this article, the authors have investigated the optimization of the buffer thickness for obtaining high-quality ZnO epi-films on sapphire substrates. The growth mechanism of the buffers with different thickness has been clearly revealed, including the initial nucleation and vertical growth, the subsequent lateral growth with small grain coalescence, and the final vertical growth along the existing larger grains. Overall, the quality of the buffer improves with increasing thickness except the deformed surface morphology. However, by a full-scale evaluation of the properties for the epi-layers, the quality of the epi-film is briefly determined by the surface morphology of the buffer, rather than the structural, optical, or electrical properties of it. The best quality epi-layer has been grown on the buffer with a smooth surface and well-coalescent grains. Meanwhile, due to the huge lattice mismatch between sapphire and ZnO, dislocations are inevitably formed during the growth of buffers. More importantly, as the film grows thicker, the dislocations may attracting other smaller dislocations and defects to reduce the total line energy and thus result in the formation of V-shape defects, which are connected with the bottom of the threading dislocations in the buffers. The V-defects appear as deep and large hexagonal pits from top view and they may act as electron traps which would affect the free carrier concentration of the epi-layers.

  11. A reliable control system for measurement on film thickness in copper chemical mechanical planarization system

    SciTech Connect

    Li, Hongkai; Qu, Zilian; Zhao, Qian; Tian, Fangxin; Zhao, Dewen; Meng, Yonggang; Lu, Xinchun

    2013-12-15

    In recent years, a variety of film thickness measurement techniques for copper chemical mechanical planarization (CMP) are subsequently proposed. In this paper, the eddy-current technique is used. In the control system of the CMP tool developed in the State Key Laboratory of Tribology, there are in situ module and off-line module for measurement subsystem. The in situ module can get the thickness of copper film on wafer surface in real time, and accurately judge when the CMP process should stop. This is called end-point detection. The off-line module is used for multi-points measurement after CMP process, in order to know the thickness of remained copper film. The whole control system is structured with two levels, and the physical connection between the upper and the lower is achieved by the industrial Ethernet. The process flow includes calibration and measurement, and there are different algorithms for two modules. In the process of software development, C++ is chosen as the programming language, in combination with Qt OpenSource to design two modules’ GUI and OPC technology to implement the communication between the two levels. In addition, the drawing function is developed relying on Matlab, enriching the software functions of the off-line module. The result shows that the control system is running stably after repeated tests and practical operations for a long time.

  12. Influence of thickness on physical properties of vacuum evaporated polycrystalline CdTe thin films for solar cell applications

    NASA Astrophysics Data System (ADS)

    Chander, Subhash; Dhaka, M. S.

    2016-02-01

    This paper presents the influence of thickness on physical properties of polycrystalline CdTe thin films. The thin films of thickness 450 nm, 650 nm and 850 nm were deposited employing thermal vacuum evaporation technique on glass and indium tin oxide (ITO) coated glass substrates. The physical properties of these as-grown thin films were investigated employing the X-ray diffraction (XRD), source meter, UV-Vis spectrophotometer, scanning electron microscopy (SEM) coupled with energy dispersive spectroscopy (EDS). The structural analysis reveals that the films have zinc-blende cubic structure and polycrystalline in nature with preferred orientation (111). The structural parameters like lattice constant, interplanar spacing, grain size, strain, dislocation density and number of crystallites per unit area are calculated. The average grain size and optical band gap are found in the range 15.16-21.22 nm and 1.44-1.63 eV respectively and observed to decrease with thickness. The current-voltage characteristics show that the electrical conductivity is observed to decrease with thickness. The surface morphology shows that films are free from crystal defects like pin holes and voids as well as homogeneous and uniform. The EDS patterns show the presence of cadmium and tellurium elements in the as grown films. The experimental results reveal that the film thickness plays significant role on the physical properties of as-grown CdTe thin films and higher thickness may be used as absorber layer to solar cells applications.

  13. Thickness-dependent cooperative aging in polycrystalline films of antiferromagnet CoO

    NASA Astrophysics Data System (ADS)

    Ma, Tianyu; Cheng, Xiang; Boettcher, Stefan; Urazhdin, Sergei; Novozhilova, Lydia

    2016-07-01

    We demonstrate that thin polycrystalline films of antiferromagnet CoO, in bilayers with ferromagnetic Permalloy, exhibit slow power-law aging of their magnetization state. The aging characteristics are remarkably similar to those previously observed in thin epitaxial Fe50Mn50 films, indicating that these behaviors are likely generic to ferromagnet/antiferromagnet bilayers. In very thin films, aging is observed over a wide temperature range. In thicker CoO, aging effects become reduced at low temperatures. Aging entirely disappears for large CoO thicknesses. We also investigate the dependence of aging characteristics on temperature and magnetic history. Analysis shows that the observed behaviors are inconsistent with the Neel-Arrhenius model of thermal activation, and are instead indicative of cooperative aging of the antiferromagnet. Our results provide new insights into the mechanisms controlling the stationary states and dynamics of ferromagnet/antiferromagnet bilayers, and potentially other frustrated magnetic systems.

  14. The thickness of DLC thin film affects the thermal conduction of HPLED lights

    NASA Astrophysics Data System (ADS)

    Hsu, Ming Seng; Huang, Jen Wei; Shyu, Feng Lin

    2016-09-01

    Thermal dissipation had an important influence in the quantum effect and life of light emitting diodes (LED) because it enabled heat transfer away from electric devices to the aluminum plate for heat removal. In the industrial processing, the quality of the thermal dissipation was decided by the gumming technique between the PCB and aluminum plate. In this study, we made the ceramic thin films of diamond like carbon (DLC) by vacuum sputtering between the substrate and high power light emitting diodes (HPLED) light to check the influence of heat transfer by DLC thin films. The ceramic dielectric coatings were characterized by several subsequent analyses, especially the measurement of real work temperature of HPLEDs. The X-Ray photoelectron spectroscopy (XPS) patterns revealed that ceramic phases were successfully grown onto the substrate. At the same time, the real work temperatures showed the thickness of DLC thin film coating effectively affected the thermal conduction of HPLEDs.

  15. Thermal and electrical conduction in ultrathin metallic films: 7 nm down to sub-nanometer thickness.

    PubMed

    Lin, Huan; Xu, Shen; Wang, Xinwei; Mei, Ning

    2013-08-12

    For ultrathin metallic films (e.g., less than 5 nm), no knowledge is yet available on how electron scattering at surface and grain boundaries reduces the electrical and thermal transport. The thermal and electrical conduction of metallic films is characterized down to 0.6 nm average thickness. The electrical and thermal conductivities of 0.6 nm Ir film are reduced by 82% and 50% from the respective bulk values. The Lorenz number is measured as 7.08 × 10⁻⁸ W Ω K⁻², almost a twofold increase of the bulk value. The Mayadas-Shatzkes model is used to interpret the experimental results and reveals very strong electron reflection (>90%) at grain boundaries.

  16. Space Charge Distribution Measurement in Insulation Film with Thickness of Several Tens μm

    NASA Astrophysics Data System (ADS)

    Hamano, Akihiro; Tanaka, Yasuhiro; Maeno, Takashi

    Since electronic equipment is required to be smaller and lighter, an insulating material for such equipment is consequently required to be thinner. However, under a certain DC voltage, the electric field in it becomes relatively higher according to the insulating material becomes thinner. Therefore, the insulating performance under high electric field must be important in such thin films. On the other hand, it is said that a space charge accumulation in them under DC high electric field is important because sometimes an electrical breakdown occurs in them due to an enhancement of electric field induced by the accumulated space charge. To investigate the characteristics of the space charge accumulation in them, PEA (Pulsed Electroacoustic) method is usually used. However, a spatial resolution of ordinary PEA system is not enough to observe the space charge distribution in thin films with thickness of several tens μm. Therefore, a new measurement system with high positional resolution is developed by making a thin piezo-electric film that is used as a sensor for PEA system. The obtained resolution of the developed system is 4 μm, and it is used for a typical measurement in LDPE film with thickness of 40 μm.

  17. Fracture Mechanism and Toughness Optimization of Macroscopic Thick Graphene Oxide Film

    PubMed Central

    Ye, Shibing; Chen, Bin; Feng, Jiachun

    2015-01-01

    Combined high strength and toughness of film materials are rather important for their industrial applications. As a new class of films, graphene oxide films (GOFs) attract intense attention in many applications but are frequently divergent, inconsistent, and poorly reproducible in their mechanical properties. In this study, we first demonstrate that different chemical compositions and assembly structures probably are responsible for the difference in elongations between cast GOFs and filtration GOFs. Comprehensive analysis of the morphologies and mechanical properties indicates that the enhanced elongation of the thick cast GOFs is mainly attributed to the presence of a unique skin-wrinkles-skin structure, which more easily forms in cast GOFs than in filtration counterparts. On the basis of this finding, we attempt to optimize the strength-toughness performance of the cast GOFs by adjusting their structures. With an appropriate thickness of 12.5 μm, the GOFs can achieve an ultrahigh toughness up to 4.37 MJ m−3, which is even comparable to the polymer-toughening graphene/GO-based paper-like materials. Such an optimization of the mechanical properties from the perspective of skin-wrinkles-skin structure appears to be a universal approach that could be extended to a variety of other film materials. PMID:26310835

  18. Ultra-soft 100 nm thick zero Poisson's ratio film with 60% reversible compressibility

    NASA Astrophysics Data System (ADS)

    Nguyen, Chieu; Szalewski, Steve; Saraf, Ravi

    2013-03-01

    Squeezing films of most solids, liquids and granular materials causes dilation in the lateral dimension which is characterized by a positive Poisson's ratio. Auxetic materials, such as, special foams, crumpled graphite, zeolites, spectrin/actin membrane, and carbon nanotube laminates shrink, i.e., their Poisson's ratio is negative. As a result of Poisson's effect, the force to squeeze an amorphous material, such as a viscous thin film coating adhered to rigid surface increases by over million fold as the thickness decreases from 10 μm to 100 nm due to constrain on lateral deformations and off-plane relaxation. We demonstrate, ultra-soft, 100 nm films of polymer/nanoparticle composite adhered to 1.25 cm diameter glass that can be reversibly squeezed over 60% strain between rigid plates requiring (very) low stresses below 100 KPa. Unlike non-zero Poisson's ratio materials, stiffness decreases with thickness, and the stress distribution is uniform over the film as mapped electro-optically. The high deformability at very low stresses is explained by considering reentrant cellular structure found in cork and the wings of beetles that have Poisson's ratio near zero.

  19. Performance Evaluation of an Oxygen Sensor as a Function of the Samaria Doped Ceria Film Thickness

    SciTech Connect

    Sanghavi, Rahul P.; Nandasiri, Manjula I.; Kuchibhatla, Satyanarayana V N T; Nachimuthu, Ponnusamy; Engelhard, Mark H.; Shutthanandan, V.; Jiang, Weilin; Thevuthasan, Suntharampillai; Kayani, Asghar N.; Prasad, Shalini

    2010-12-01

    The current demand in the automobile industry is in the control of air-fuel mixture in the combustion engine of automobiles. Oxygen partial pressure can be used as an input parameter for regulating or controlling systems in order to optimize the combustion process. Our goal is to identify and optimize the material system that would potentially function as the active sensing material for such a device that monitors oxygen partial pressure in these systems. We have used thin film samaria doped ceria (SDC) as the sensing material for the sensor operation, exploiting the fact that at high temperatures, oxygen vacancies generated due to samarium doping act as conducting medium for oxygen ions which hop through the vacancies from one side to the other contributing to an electrical signal. We have recently established that 6 atom % Sm doping in ceria films has optimum conductivity. Based on this observation, we have studied the variation in the overall conductivity of 6 atom % samaria doped ceria thin films as a function of thickness in the range of 50 nm to 300 nm at a fixed bias voltage of 2 volts. A direct proportionality in the increase in the overall conductivity is observed with the increase in sensing film thickness. For a range of oxygen pressure values from 1 mTorr to 100 Torr, a tolerable hysteresis error, good dynamic response and a response time of less than 10 seconds was observed

  20. Thickness Dependency of Thin Film Samaria Doped Ceria for Oxygen Sensing

    SciTech Connect

    Sanghavi, Rahul P.; Nandasiri, Manjula I.; Kuchibhatla, Satyanarayana V N T; Jiang, Weilin; Varga, Tamas; Nachimuthu, Ponnusamy; Engelhard, Mark H.; Shutthanandan, V.; Thevuthasan, Suntharampillai; Kayani, Asghar N.; Prasad, Shalini

    2011-01-01

    High temperature oxygen sensors are widely used for exhaust gas monitoring in automobiles. This particular study explores the use of thin film single crystalline samaria doped ceria as the oxygen sensing material. Desired signal to noise ratio can be achieved in a material system with high conductivity. From previous studies it is established that 6 atomic percent samarium doping is the optimum concentration for thin film samaria doped ceria to achieve high ionic conductivity. In this study, the conductivity of the 6 atomic percent samaria doped ceria thin film is measured as a function of the sensing film thickness. Hysteresis and dynamic response of this sensing platform is tested for a range of oxygen pressures from 0.001 Torr to 100 Torr for temperatures above 673 K. An attempt has been made to understand the physics behind the thickness dependent conductivity behavior of this sensing platform by developing a hypothetical operating model and through COMSOL simulations. This study can be used to identify the parameters required to construct a fast, reliable and compact high temperature oxygen sensor.

  1. Thickness dependent electronic structure and morphology of rubrene thin films on metal, semiconductor, and dielectric substrates

    NASA Astrophysics Data System (ADS)

    Sinha, Sumona; Mukherjee, M.

    2013-08-01

    The evolution of the electronic structure and morphology of rubrene thin films on noble-metal, semiconductor and dielectric substrates have been investigated as a function of thickness of deposited films by using photoelectron spectroscopy and atomic force microscopy. The clean polycrystalline Au and Ag were used as noble-metals, whereas, H passivated and SiO2 coated Si (100) were used as semiconductors and dielectric substrates. Discussion and comparison on interface dipole, energy level alignment, and surface morphology for the four cases are presented. The formation of dipole at metallic interfaces is found to occur due to push back effect. S parameter obtained from the variation of barrier height with the change of work function of the contacting metal indicates moderately weak interaction between rubrene and the metal substrates. The thickness dependent energy level alignment of the physisorbed rubrene films on different substrates is explained by a dielectric model in terms of electrostatic screening of photo-holes or photoemission final state relaxation energy. Films on all the substrates are found to grow following Stranski-Krastnov type growth mode and are more ordered at higher coverage.

  2. Estimation of appropriate lubricating film thickness in ceramic-on-ceramic hip prostheses

    NASA Astrophysics Data System (ADS)

    Tauviqirrahman, M.; Muchammad, Bayuseno, A. P.; Ismail, R.; Saputra, E.; Jamari, J.

    2016-04-01

    Artificial hip prostheses, consisting of femoral head and acetabular cup are widely used and have affected the lives of many people.However, the primary issue associated with the long term performance of hip prostheses is loosening induced by excessive wear during daily activity. Therefore, an effective lubrication is necessary to significantly decrease the wear. To help understand the lubricating performance of such typical hip joint prostheses, in the present paper a hydrodynamic lubrication model based on Reynolds equationwas introduced. The material pairs of ceramic acetabular cup against ceramic femoral head was investegated.The main aim of this study is to investigate of the effect of loading on the formation of lubricating film thickness.The model of a ball-in-socket configuration was considered assuming that the cup was stationary while the ball was to rotate at a steady angular velocityvarying loads.Based on simulation result, it was found that to promote fluid film lubrication and prevent the contacting components leading to wear, the film thickness of lubricant should be determined carefully based on the load applied. This finding may have useful implication in predicting the failure of lubricating synovial fluid film and wear generation in hip prostheses.

  3. Thin-Thick Coexistence Behavior of 8CB Liquid Crystalline Films on Silicon

    NASA Astrophysics Data System (ADS)

    Garcia, R.; Subashi, E.; Fukuto, M.

    2008-05-01

    The wetting behavior of thin films of 4-n-octyl-4'-cyanobiphenyl (8CB) on Si is investigated via optical and x-ray reflectivity measurement. An experimental phase diagram is obtained showing a broad thick-thin coexistence region spanning the bulk isotropic-to-nematic (TIN) and the nematic-to-smectic-A (TNA) temperatures. For Si surfaces with coverages between 47 and 72±3nm, reentrant wetting behavior is observed twice as we increase the temperature, with separate coexistence behaviors near TIN and TNA. For coverages less than 47 nm, however, the two coexistence behaviors merge into a single coexistence region. The observed thin-thick coexistence near the second-order NA transition is not anticipated by any previous theory or experiment. Nevertheless, the behavior of the thin and thick phases within the coexistence regions is consistent with this being an equilibrium phenomenon.

  4. Thick YBa2Cu3O7-x BaSnO3 Films with Enhanced Critical Current Density at High Magnetic Fields

    DTIC Science & Technology

    2008-10-01

    thick YBCO +BSO film had a Jc ~3×105 A/cm2 at 5 T as compared to a typical Jc of 2.4×103 A/cm2 at 5 T for a 300- nm -thick YBCO film. The thick YBCO +BSO...for a 300 nm thick YBCO film. The thick YBCO +BSO films maintained high Tc 88 K and had a high density 2.51011 /cm2 of continuous BSO nanocolumns...nanocolumns to maintain a high Jc in high magnetic fields without a reduction in Tc. Recently 300 nm thick YBCO +BSO nanocomposite films were processed using

  5. Effect of film thickness on structural and mechanical properties of AlCrN nanocompoite thin films deposited by reactive DC magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Prakash, Ravi; Kaur, Davinder

    2016-05-01

    In this study, the influence of film thickness on the structural, surface morphology and mechanical properties of Aluminum chromium nitride (AlCrN) thin films has been successfully investigated. The AlCrN thin films were deposited on silicon (100) substrate using dc magnetron reactive co-sputtering at substrate temperature 400° C. The structural, surface morphology and mechanical properties were studied using X-ray diffraction, field-emission scanning electron microscopy and nanoindentation techniques respectively. The thickness of these thin films was controlled by varying the deposition time therefore increase in deposition time led to increase in film thickness. X-ray diffraction pattern of AlCrN thin films with different deposition time shows the presence of (100) and (200) orientations. The crystallite size varies in the range from 12.5 nm to 36.3 nm with the film thickness due to surface energy minimization with the higher film thickness. The hardness pattern of these AlCrN thin films follows Hall-Petch relation. The highest hardness 23.08 Gpa and young modulus 215.31 Gpa were achieved at lowest grain size of 12.5 nm.

  6. Influences of film thickness and annealing temperature on properties of sol-gel derived ZnO-SnO2 nanocomposite thin film

    NASA Astrophysics Data System (ADS)

    Lee, Sang-Min; Joo, Young-Hee; Kim, Chang-Il

    2014-11-01

    In this study, ZnO-SnO2 nanocomposite thin film was prepared on glass substrates with different film thicknesses and annealing temperatures through a sol-gel method. From the results of thermogravimetric analysis (TGA), it was deduced that the ZnO-SnO2 thin film could be sufficiently formed at approximately 500 °C. The XRD patterns showed enhanced crystallinity of the ZnO-SnO2 thin film with increasing film thickness and annealing temperature. However, it was also revealed that the crystallinity deteriorated when the film thickness and annealing temperature are 270 nm and 700 °C, respectively. The variation in electrical resistivity corresponded to intensities of the (0 0 2) diffraction peaks shown in the XRD patterns. It was also found that the increase of film thickness and annealing temperature led to rougher surface morphology and to an increase in grain size. The optical properties deteriorated with increasing film thickness and annealing temperature of the ZnO-SnO2 thin films.

  7. Friction measurements of nanometer-thick lubricant films using ultra-smooth sliding pins treated with gas cluster ion beam

    NASA Astrophysics Data System (ADS)

    Lu, Renguo; Zhang, Hedong; Mitsuya, Yasunaga; Fukuzawa, Kenji; Itoh, Shintaro

    2013-09-01

    Friction properties of nanometer-thick lubricant films confined between two ultra-smooth solid surfaces are crucial to the practical performance of technologically advanced mechanical devices such as micro-electro-mechanical systems and hard disk drives. In this work, we applied argon gas cluster ion beam (Ar-GCIB) treatments to obtain ultra-smooth sliding pins for pin-on-disk tests of nanometer-thick perfluoropolyether (PFPE) lubricant films coated on magnetic disk surfaces. The GCIB treatments effectively smoothed the pin surfaces, and increases in the Ar dose decreased surface roughness. An ultra-smooth surface with a maximum peak height (Rp) less the monolayer lubricant film thickness was achieved when the Ar dose was increased to 8 × 1016 ions/cm2. We observed that both surface roughness and film thickness affected the friction coefficients of the PFPE films. To quantitatively describe the interplay of surface roughness and film thickness, we introduced two roughness characteristics: the ratio of film thickness to the surface’s root-mean-square roughness (h/σ), and a surface-pattern parameter (γ), defined as the ratio of correlation lengths in two orthogonal directions. We infer that a fixed γ and higher h/σlead to lower friction coefficients, while a fixed h/σand higher γ induce higher friction coefficients.

  8. Approximately 800-nm-Thick Pinhole-Free Perovskite Films via Facile Solvent Retarding Process for Efficient Planar Solar Cells.

    PubMed

    Yuan, Zhongcheng; Yang, Yingguo; Wu, Zhongwei; Bai, Sai; Xu, Weidong; Song, Tao; Gao, Xingyu; Gao, Feng; Sun, Baoquan

    2016-12-21

    Device performance of organometal halide perovskite solar cells significantly depends on the quality and thickness of perovskite absorber films. However, conventional deposition methods often generate pinholes within ∼300 nm-thick perovskite films, which are detrimental to the large area device manufacture. Here we demonstrated a simple solvent retarding process to deposit uniform pinhole free perovskite films with thicknesses up to ∼800 nm. Solvent evaporation during the retarding process facilitated the components separation in the mixed halide perovskite precursors, and hence the final films exhibited pinhole free morphology and large grain sizes. In addition, the increased precursor concentration after solvent-retarding process led to thick perovskite films. Based on the uniform and thick perovskite films prepared by this convenient process, a champion device efficiency up to 16.8% was achieved. We believe that this simple deposition procedure for high quality perovskite films around micrometer thickness has a great potential in the application of large area perovskite solar cells and other optoelectronic devices.

  9. Stoichiometry and thickness dependence of superconducting properties of niobium nitride thin films

    SciTech Connect

    Beebe, Melissa R. Beringer, Douglas B.; Burton, Matthew C.; Yang, Kaida; Lukaszew, R. Alejandra

    2016-03-15

    The current technology used in linear particle accelerators is based on superconducting radio frequency (SRF) cavities fabricated from bulk niobium (Nb), which have smaller surface resistance and therefore dissipate less energy than traditional nonsuperconducting copper cavities. Using bulk Nb for the cavities has several advantages, which are discussed elsewhere; however, such SRF cavities have a material-dependent accelerating gradient limit. In order to overcome this fundamental limit, a multilayered coating has been proposed using layers of insulating and superconducting material applied to the interior surface of the cavity. The key to this multilayered model is to use superconducting thin films to exploit the potential field enhancement when these films are thinner than their London penetration depth. Such field enhancement has been demonstrated in MgB{sub 2} thin films; here, the authors consider films of another type-II superconductor, niobium nitride (NbN). The authors present their work correlating stoichiometry and superconducting properties in NbN thin films and discuss the thickness dependence of their superconducting properties, which is important for their potential use in the proposed multilayer structure. While there are some previous studies on the relationship between stoichiometry and critical temperature T{sub C}, the authors are the first to report on the correlation between stoichiometry and the lower critical field H{sub C1}.

  10. The Effects of Two Thick Film Deposition Methods on Tin Dioxide Gas Sensor Performance

    PubMed Central

    Bakrania, Smitesh D.; Wooldridge, Margaret S.

    2009-01-01

    This work demonstrates the variability in performance between SnO2 thick film gas sensors prepared using two types of film deposition methods. SnO2 powders were deposited on sensor platforms with and without the use of binders. Three commonly utilized binder recipes were investigated, and a new binder-less deposition procedure was developed and characterized. The binder recipes yielded sensors with poor film uniformity and poor structural integrity, compared to the binder-less deposition method. Sensor performance at a fixed operating temperature of 330 °C for the different film deposition methods was evaluated by exposure to 500 ppm of the target gas carbon monoxide. A consequence of the poor film structure, large variability and poor signal properties were observed with the sensors fabricated using binders. Specifically, the sensors created using the binder recipes yielded sensor responses that varied widely (e.g., S = 5 – 20), often with hysteresis in the sensor signal. Repeatable and high quality performance was observed for the sensors prepared using the binder-less dispersion-drop method with good sensor response upon exposure to 500 ppm CO (S = 4.0) at an operating temperature of 330 °C, low standard deviation to the sensor response (±0.35) and no signal hysteresis. PMID:22399977

  11. Field dependent resonance frequency of hysteresis loops in a few monolayer thick Co/Cu(001) films

    NASA Astrophysics Data System (ADS)

    Jiang, Q.; Yang, H.-N.; Wang, G.-C.

    1996-04-01

    Dynamic responses of magnetic hysteresis loops in a few monolayer (ML) thick Co/Cu(001) films were studied using surface magneto-optic Kerr effect (SMOKE). For a fixed external field strength H0, the hysteresis loop area increases as a function of frequency with a power law and reaches a maximum at a resonance frequency Ω0. This Ω0 depends on the external periodic field strength as well as the thickness and roughness of the films. The thickness and roughness parameters were measured quantitatively using high-resolution low-energy electron diffraction. For a fixed film thickness, the Ω0 in the low field region is highly dependent on H0, which is consistent with the prediction from the mean field model. For two Co films with an equivalent thickness but different degrees of film roughness, the resonance frequency Ω0 is lower for the rougher films in all the field strengths studied. For a fixed field strength, the value of Ω0 decreases as Co film roughness increases in a few ML regime. The roughness dependency in Ω0 indicates that the slowing down in the magnetization reversal process is due to the increased film roughness.

  12. Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films

    SciTech Connect

    Prakash, Deo; Shaaban, E.R.; Shapaan, M.; Mohamed, S.H.; Othman, A.A.; Verma, K.D.

    2016-08-15

    Highlights: • Combined experimental and theoretical researches on ZnSe Thin Films. • The film thickness and refractive index were determined using envelope method. • The absorption coefficient and the energy gap were calculated. • Dispersion parameters were determined using Wemple-DiDomenico relation. • The third order susceptibility and nonlinear refractive index were calculated. - Abstract: Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702 eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films.

  13. Effect of thickness on structural, optical, electrical and morphological properties of nanocrystalline CdSe thin films for optoelectronic applications

    NASA Astrophysics Data System (ADS)

    Purohit, Anuradha; Chander, S.; Nehra, S. P.; Lal, C.; Dhaka, M. S.

    2015-09-01

    This paper presents effect of thickness on the physical properties of thermally evaporated cadmium selenide thin films. The films of thickness 445 nm, 631 nm and 810 nm were deposited employing thermal evaporation technique on glass and ITO coated glass substrates followed by thermal annealing in air atmosphere at temperature 300 °C. The as-deposited and annealed films were subjected to the XRD, UV-Vis spectrophotometer, source meter, SEM and EDS to find the structural, optical, electrical, morphological and compositional analysis respectively. The structural analysis shows that the films have cubic phase with preferred orientation (1 1 1) and nanocrystalline nature. The structural parameters like inter-planner spacing, lattice constant, grain size, number of crystallites per unit area, internal strain, dislocation density and texture coefficient are calculated. The optical band gap is found in the range 1.69-1.84 eV and observed to decrease with thickness. The electrical resistivity is found to increase with thickness for as-deposited films and decrease for annealed films. The morphological studies show that the as-deposited and annealed films are homogeneous, smooth, fully covered and free from crystal defects like pin holes and voids. The grains in the as-deposited films are densely packed, well defined and found to be increased with thickness.

  14. TOF mobility measurements in pristine films of P3HT: control of hole injection and influence of film thickness

    NASA Astrophysics Data System (ADS)

    Ballantyne, Amy M.; Wilson, Joanne S.; Nelson, Jenny; Bradley, Donal D. C.; Durrant, James R.; Heeney, Martin; Duffy, Warren; McCulloch, Iain

    2006-08-01

    Time-of-flight (TOF) photocurrent measurements have been used to study charge transport in films of regioregular poly(3-hexylthiophene) (P3HT). Devices in which the P3HT film had been deposited directly onto an indium tin oxide (ITO) electrode produced high dark currents as a result of hole injection into P3HT from ITO. Photocurrent transients in such devices were disperse. It was found however, that these dark currents could be significantly reduced by inserting a dense TiO II layer between the ITO and the polymer film. The resulting devices gave non-dispersive transients with hole and electron mobilities in the range of 1 - 2 10 -4 cm2 V -1 s -1 at room temperature. The mobility values were observed to be almost independent of film thickness over the range of 350 nm to 4.3 μm. Temperature dependence studies showed a weak dependence on temperature with a low energetic disorder parameter according to analysis using the Gaussian Disorder Model (GDM) of 71 meV.

  15. Structural Properties Characterized by the Film Thickness and Annealing Temperature for La2O3 Films Grown by Atomic Layer Deposition.

    PubMed

    Wang, Xing; Liu, Hongxia; Zhao, Lu; Fei, Chenxi; Feng, Xingyao; Chen, Shupeng; Wang, Yongte

    2017-12-01

    La2O3 films were grown on Si substrates by atomic layer deposition technique with different thickness. Crystallization characteristics of the La2O3 films were analyzed by grazing incidence X-ray diffraction after post-deposition rapid thermal annealing treatments at several annealing temperatures. It was found that the crystallization behaviors of the La2O3 films are affected by the film thickness and annealing temperatures as a relationship with the diffusion of Si substrate. Compared with the amorphous La2O3 films, the crystallized films were observed to be more unstable due to the hygroscopicity of La2O3. Besides, the impacts of crystallization characteristics on the bandgap and refractive index of the La2O3 films were also investigated by X-ray photoelectron spectroscopy and spectroscopic ellipsometry, respectively.

  16. Thickness effect on laser-induced-damage threshold of indium-tin oxide films at 1064 nm

    NASA Astrophysics Data System (ADS)

    Wang, Haifeng; Huang, Zhimeng; Zhang, Dayong; Luo, Fei; Huang, Lixian; Li, Yanglong; Luo, Yongquan; Wang, Weiping; Zhao, Xiangjie

    2011-12-01

    Laser-induced-damage characteristics of commercial indium-tin oxide (ITO) films deposited by DC magnetron sputtering deposition on K9 glass substrates as a function of the film thickness have been studied at 1064 nm with a 10 ns laser pulse in the 1-on-1 mode, and the various mechanisms for thickness effect on laser-induced-damage threshold (LIDT) of the film have been discussed in detail. It is observed that laser-damage-resistance of ITO film shows dramatic thickness effect with the LIDT of the 50-nm ITO film 7.6 times as large as the value of 300 nm film, and the effect of depressed carrier density by decreasing the film thickness is demonstrated to be the primary reason. Our experiment findings indicate that searching transparent conductive oxide (TCO) film with low carrier density and high carrier mobility is an efficient technique to improve the laser-damage-resistance of TCO films based on maintaining their well electric conductivity.

  17. Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

    NASA Astrophysics Data System (ADS)

    Figueroa, A. I.; Zhang, S. L.; Baker, A. A.; Chalasani, R.; Kohn, A.; Speller, S. C.; Gianolio, D.; Pfleiderer, C.; van der Laan, G.; Hesjedal, T.

    2016-11-01

    We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500 Å) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investigated are phase-pure and of high quality with a sharp interface between MnSi and Si. The investigated MnSi films are in a thickness regime where the magnetic transition temperature Tc assumes a thickness-independent enhanced value of ≥43 K as compared with that of bulk MnSi, where Tc≈29 K . A detailed refinement of the EXAFS data reveals that the Mn positions are unchanged, whereas the Si positions vary along the out-of-plane [111] direction, alternating in orientation from unit cell to unit cell. Thus, for thick MnSi films, the unit cell volume is essentially that of bulk MnSi—except in the vicinity of the interface with the Si substrate (thin film limit). In view of the enhanced magnetic transition temperature we conclude that the mere presence of the interface, and its specific characteristics, strongly affects the magnetic properties of the entire MnSi film, even far from the interface. Our analysis provides invaluable information about the local strain at the MnSi/Si(111) interface. The presented methodology of polarization dependent EXAFS can also be employed to investigate the local structure of other interesting interfaces.

  18. Thickness-dependent structural arrangement in nano-confined imidazolium-based ionic liquid films.

    PubMed

    Rouha, Michael; Cummings, Peter T

    2015-02-14

    A fundamental understanding of interfacial processes in nano-confined ionic liquids is crucial to increase the performance of modern energy storage devices. It is well-known that interfaces between electrodes and ionic liquids exhibit structures distinct from that of the bulk liquid. Following the recent interest in these systems, we studied the structure of thin ionic liquid films confined in flexible uncharged carbon nano-pores by using fully-atomistic molecular dynamics simulations. We show that the interfacial ions self-assemble into a closely-packed chequerboard-like pattern, formed by both cations and anions in direct contact with the pore wall, and that within this structure we find changes dependent on the thickness of the confined films. At low coverages a dense layer is formed in which both the imidazolium-ring and its alkyl-tail lie parallel to the pore wall. With increasing coverage the alkyl-chains reorient perpendicular to the surface, making space for additional ions until a densified highly ordered layer is formed. This wall-induced self-patterning into interfacial layers with significantly higher than bulk density is consistent with recent experimental and theoretical studies of similar systems. This work reveals additional molecular-level details on the effect of the film-thickness on the structure and density of the ionic liquid.

  19. Effects of surface roughness and film thickness on the adhesion of a bioinspired nanofilm.

    PubMed

    Peng, Z L; Chen, S H

    2011-05-01

    Inspired by the gecko's climbing ability, adhesion between an elastic nanofilm with finite length and a rough substrate with sinusoidal roughness is studied in the present paper, considering the effects of substrate roughness and film thickness. It demonstrates that the normal adhesion force of the nanofilm on a rough substrate depends significantly on the geometrical parameters of the substrate. When the film length is larger than the wavelength of the sinusoidal roughness of the substrate, the normal adhesion force decreases with increasing surface roughness, while the normal adhesion force initially decreases then increases if the wavelength of roughness is larger than the film length. This finding is qualitatively consistent with a previously interesting experimental observation in which the adhesion force of the gecko spatula is found to reduce significantly at an intermediate roughness. Furthermore, it is inferred that the gecko may achieve an optimal spatula thickness not only to follow rough surfaces, but also to saturate the adhesion force. The results in this paper may be helpful for understanding how geckos overcome the influence of natural surface roughness and possess such adhesion to support their weights.

  20. Enhanced heat transfer is dependent on thickness of graphene films: the heat dissipation during boiling

    NASA Astrophysics Data System (ADS)

    Ahn, Ho Seon; Kim, Jin Man; Kim, Taejoo; Park, Su Cheong; Kim, Ji Min; Park, Youngjae; Yu, Dong In; Hwang, Kyoung Won; Jo, Hangjin; Park, Hyun Sun; Kim, Hyungdae; Kim, Moo Hwan

    2014-09-01

    Boiling heat transfer (BHT) is a particularly efficient heat transport method because of the latent heat associated with the process. However, the efficiency of BHT decreases significantly with increasing wall temperature when the critical heat flux (CHF) is reached. Graphene has received much recent research attention for applications in thermal engineering due to its large thermal conductivity. In this study, graphene films of various thicknesses were deposited on a heated surface, and enhancements of BHT and CHF were investigated via pool-boiling experiments. In contrast to the well-known surface effects, including improved wettability and liquid spreading due to micron- and nanometer-scale structures, nanometer-scale folded edges of graphene films provided a clue of BHT improvement and only the thermal conductivity of the graphene layer could explain the dependence of the CHF on the thickness. The large thermal conductivity of the graphene films inhibited the formation of hot spots, thereby increasing the CHF. Finally, the provided empirical model could be suitable for prediction of CHF.

  1. Thickness-dependent structural arrangement in nano-confined imidazolium-based ionic liquid films

    DOE PAGES

    Rouha, Michael; Cummings, Peter T.

    2014-12-24

    Here we report that a fundamental understanding of interfacial processes in nano-confined ionic liquids is crucial to increase the performance of modern energy storage devices. It is well-known that interfaces between electrodes and ionic liquids exhibit structures distinct from that of the bulk liquid. Following the recent interest in these systems, we studied the structure of thin ionic liquid films confined in flexible uncharged carbon nano-pores by using fully-atomistic molecular dynamics simulations. We show that the interfacial ions self-assemble into a closely-packed chequerboard-like pattern, formed by both cations and anions in direct contact with the pore wall, and that withinmore » this structure we find changes dependent on the thickness of the confined films. At low coverages a dense layer is formed in which both the imidazolium-ring and its alkyl-tail lie parallel to the pore wall. With increasing coverage the alkyl-chains reorient perpendicular to the surface, making space for additional ions until a densified highly ordered layer is formed. This wall-induced self-patterning into interfacial layers with significantly higher than bulk density is consistent with recent experimental and theoretical studies of similar systems. Lastly, this work reveals additional molecular-level details on the effect of the film-thickness on the structure and density of the ionic liquid.« less

  2. Thickness-dependent structural arrangement in nano-confined imidazolium-based ionic liquid films

    SciTech Connect

    Rouha, Michael; Cummings, Peter T.

    2014-12-24

    Here we report that a fundamental understanding of interfacial processes in nano-confined ionic liquids is crucial to increase the performance of modern energy storage devices. It is well-known that interfaces between electrodes and ionic liquids exhibit structures distinct from that of the bulk liquid. Following the recent interest in these systems, we studied the structure of thin ionic liquid films confined in flexible uncharged carbon nano-pores by using fully-atomistic molecular dynamics simulations. We show that the interfacial ions self-assemble into a closely-packed chequerboard-like pattern, formed by both cations and anions in direct contact with the pore wall, and that within this structure we find changes dependent on the thickness of the confined films. At low coverages a dense layer is formed in which both the imidazolium-ring and its alkyl-tail lie parallel to the pore wall. With increasing coverage the alkyl-chains reorient perpendicular to the surface, making space for additional ions until a densified highly ordered layer is formed. This wall-induced self-patterning into interfacial layers with significantly higher than bulk density is consistent with recent experimental and theoretical studies of similar systems. Lastly, this work reveals additional molecular-level details on the effect of the film-thickness on the structure and density of the ionic liquid.

  3. Advances in thickness measurements and dynamic visualization of the tear film using non-invasive optical approaches.

    PubMed

    Bai, Yuqiang; Nichols, Jason J

    2017-02-23

    The thickness of tear film has been investigated under both invasive and non-invasive methods. While invasive methods are largely historical, more recent noninvasive methods are generally based on optical approaches that provide accurate, precise, and rapid measures. Optical microscopy, interferometry, and optical coherence tomography (OCT) have been developed to characterize the thickness of tear film or certain aspects of the tear film (e.g., the lipid layer). This review provides an in-depth overview on contemporary optical techniques used in studying the tear film, including both advantages and limitations of these approaches. It is anticipated that further developments of high-resolution OCT and other interferometric methods will enable a more accurate and precise measurement of the thickness of the tear film and its related dynamic properties.

  4. Fe-Si-Cr/PTFE magnetic composite thick films on polyethylene terephthalate sheets for near field communications by aerosol deposition.

    PubMed

    Kim, Hyung-Jun; Nam, Song-Min; Koh, Jung-Hyuk

    2014-10-01

    Thick film growth of Fe-Si-Cr/poly-tetra-fluoro-ethylene (PTFE) composite films on polyethylene terephthalate (PET) sheets was investigated by aerosol deposition (AD) as a magnetic absorber for near field communication. The Fe-Si-Cr flakes were crushed to micro flakes smaller than 1 μm after the deposition, and formed dense microstructure on the PET sheets. The Fe-Si-Cr/PTFE composite thick films using 0.2 wt.% PTFE starting powder showed dense and uniform microstructure compared to the 0.5 wt.% film. The real relative permeability /' and the imaginary permeability μ" of Fe-Si-Cr/PTFE composite thick films using the 0.2 wt.% PTFE starting powder were 13.1 and 2.9 at 13.56 MHz, respectively. In the case of 0.5 wt.%, μ' and μ" respectively decreased to 7.4 and 1.0 at 13.56 MHz caused by adding PTFE.

  5. Scanning white-light interferometer for measurement of the thickness of a transparent oil film on water.

    PubMed

    Sun, Changsen; Yu, Longcheng; Sun, Yuxing; Yu, Qingxu

    2005-09-01

    The thickness of a transparent layer of oil upon the surface of water is measured as the distance between the surface of oil film and the interface of the oil with the water. Two experimental results have demonstrated that the interface can reflect a white-light beam well enough to form an interferogram, even if the light is subjected to oil-film dispersion. When a beam of white light is incident vertically onto the oil-film surface, a scanning white-light interferometer in the Michelson configuration is employed to locate two serial reflections, surface reflection and interface reflection. The thickness of the transparent oil film on water is calculated based on the separation of these two interferograms. A limitation thickness, approximately 250 microm with 1.25 microm resolution, is achieved under the condition that there is 50 nW of optical power incident onto the oil-film surface with a wavelength centered at 1310 nm.

  6. Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films

    SciTech Connect

    Shen, Xuan; Qiu, Xiangbiao; Su, Dong; Zhou, Shengqiang; Li, Aidong; Wu, Di

    2015-01-06

    Transport characteristics of ultrathin SrRuO₃ films, deposited epitaxially on TiO₂-terminated SrTiO₃ (001) single-crystal substrates, were studied as a function of film thickness. Evolution from a metallic to an insulating behavior is observed as the film thickness decreases from 20 to 4 unit cells. In films thicker than 4 unit cells, the transport behavior obeys the Drude low temperature conductivity with quantum corrections, which can be attributed to weak localization. Fitting the data with 2-dimensional localization model indicates that electron-phonon collisions are the main inelastic relaxation mechanism. In the film of 4 unit cells in thickness, the transport behavior follows variable range hopping model, indicating a strongly localized state. As a result, magnetoresistance measurements reveal a likely magnetic anisotropy with the magnetic easy axis along the out-of-plane direction.

  7. Effect of finite magnetic film thickness on Néel coupling in spin valves

    NASA Astrophysics Data System (ADS)

    Kools, J. C. S.; Kula, W.; Mauri, Daniele; Lin, Tsann

    1999-04-01

    Spin valves are widely studied due to their application as magnetoresistive material in magnetic recording heads and other magnetic field sensors. An important film property is the interlayer coupling field (called offset field Ho or ferromagnetic coupling field Hf). It has been shown that the Néel model for orange-peel coupling can be applied successfully to describe this interlayer coupling. The waviness associated with the developing granular structure is thereby taken as the relevant waviness. The original Néel model describes the ferromagnetic magnetostatic interaction between two ferromagnetic layers, of infinite thickness, separated by a nonmagnetic spacer with a correlated interface waviness. In this article, this physical picture is refined to account for the effect of the finite thickness of the magnetic films in a spin valve. Magnetic poles created at the outer surfaces of the magnetic layers result in an antiferromagnetic interaction with the poles at the inner surface of the opposite layer. A simple model is presented for the different interactions in a top spin valve (columnar structure with cumulative waviness on a flat substrate) and for a bottom spin valve (columnar structure with conformal waviness on a way substrate). Comparison to experimental data, shows that the free and pinned layer thickness dependence can be understood from this refined picture.

  8. Dynamic mask for producing uniform or graded-thickness thin films

    DOEpatents

    Folta, James A.

    2006-06-13

    A method for producing single layer or multilayer films with high thickness uniformity or thickness gradients. The method utilizes a moving mask which blocks some of the flux from a sputter target or evaporation source before it deposits on a substrate. The velocity and position of the mask is computer controlled to precisely tailor the film thickness distribution. The method is applicable to any type of vapor deposition system, but is particularly useful for ion beam sputter deposition and evaporation deposition; and enables a high degree of uniformity for ion beam deposition, even for near-normal incidence of deposition species, which may be critical for producing low-defect multilayer coatings, such as required for masks for extreme ultraviolet lithography (EUVL). The mask can have a variety of shapes, from a simple solid paddle shape to a larger mask with a shaped hole through which the flux passes. The motion of the mask can be linear or rotational, and the mask can be moved to make single or multiple passes in front of the substrate per layer, and can pass completely or partially across the substrate.

  9. Investigation of thickness uniformity of thin metal films by using α-particle energy loss method and successive scanning measurements

    NASA Astrophysics Data System (ADS)

    Li, Gang; Xu, Jiayun; Bai, Lixin

    2017-03-01

    The metal films are widely used in the Inertial Confinement Fusion (ICF) experiments to obtain the radiation opacity, and the accuracy of the measuring results mainly depends on the accuracy of the film thickness and thickness uniformity. The traditional used measuring methods all have various disadvantages, the optical method and stylus method cannot provide mass thickness which reflects the internal density distribution of the films, and the weighing method cannot provide the uniformity of the thickness distribution. This paper describes a new method which combines the α-particle energy loss (AEL) method and the successive scanning measurements to obtain the film thickness and thickness uniformity. The measuring system was partly installed in the vacuum chamber, and the relationship of chamber pressure and energy loss caused by the residual air in the vacuum chamber was studied for the source-to-detector distance ranging from 1 to 5 cm. The results show that the chamber pressure should be less than 10 Pa for the present measuring system. In the process of measurement, the energy spectrum of α-particles transmitted through each different measuring point were obtained, and then recorded automatically by a self-developed multi-channel analysis software. At the same time, the central channel numbers of the spectrum (CH) were also saved in a text form document. In order to realize the automation of data processing and represent the thickness uniformity visually in a graphic 3D plot, a software package was developed to convert the CH values into film thickness and thickness uniformity. The results obtained in this paper make the film thickness uniformity measurements more accurate and efficient in the ICF experiments.

  10. Effects of deposition rate and thickness on the properties of YBCO films deposited by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Shi, D. Q.; Ko, R. K.; Song, K. J.; Chung, J. K.; Choi, S. J.; Park, Y. M.; Shin, K. C.; Yoo, S. I.; Park, C.

    2004-02-01

    YBCO films with various thicknesses from 100 nm to 1.6 µm were deposited on single crystal SrTiO3 substrates by pulsed laser deposition (PLD). The effects of thickness and deposition rate—by means of controlling the pulsed laser frequency—on the critical current density (Jc) were studied. X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to examine the orientation, crystallization and surface quality. The amount of a-axis YBCO component evaluated from the ratio of XRD chi-scan intensities of the a-axis and c-axis for the YBCO (102) plane increased as the YBCO film became thicker. SEM was used to analyse the surface of YBCO film, and it was shown that the surface of YBCO film became rougher with increasing thickness. There were many large singular outgrowths and networks of outgrowths on the surface of the YBCO films with thickness greater than 0.4 µm. The increased amount of a-axis YBCO component and the coarse microstructure of the thick YBCO film caused degradation of Jc with increasing thickness.

  11. Influence of the interface on the magnetic properties of ferromagnetic ultrathin films with various adjacent copper thicknesses

    SciTech Connect

    Zhang, Dong; Jiang, Sheng; Luo, Chen; Wang, Yukun; Rui, Wenbin; Du, Jun; Zhai, Hongru; Zhai, Ya

    2014-05-07

    The interface and magnetic properties of two series of films with Ta(5 nm)/Fe{sub 20}Ni{sub 80}Nd{sub 0.017}(3 nm)/Cu(t nm) and Ta(5 nm)/Cu(t nm)/Fe{sub 50}Co{sub 50}Gd{sub 0.07}(3 nm)/Cu(2 nm) structures have been investigated by atomic force microscopy, vibrating sample magnetometer, and ferromagnetic resonance (FMR). The roughness of all films increases with increasing copper thickness, which causes the different grain sizes in the surface of films. The coercivity of FeCo-Gd films increases with increasing thickness of inserted Cu layer while decreases with increasing thickness of Cu capping layer for FeNi-Nd films. FMR linewidth exhibits huge dependence on the thickness of inserted Cu layer for FeCo-Gd films, increasing from 2270 to 3680 Oe, which comes from the additional contribution of effect of the two-magnon scattering. And the thickness of Cu capping layer shows also an influence on FMR linewidth of FeNi-Nd films, increasing from 190 to 320 Oe, which mainly comes from intrinsic FMR linewidth and plus minor inhomogeneous broadening. All of these extrinsic linewidth broadening are related to the interface roughness.

  12. Influence of the interface on the magnetic properties of ferromagnetic ultrathin films with various adjacent copper thicknesses

    NASA Astrophysics Data System (ADS)

    Zhang, Dong; Jiang, Sheng; Luo, Chen; Wang, Yukun; Rui, Wenbin; Zhai, Ya; Du, Jun; Zhai, Hongru

    2014-05-01

    The interface and magnetic properties of two series of films with Ta(5 nm)/Fe20Ni80Nd0.017(3 nm)/Cu(t nm) and Ta(5 nm)/Cu(t nm)/Fe50Co50Gd0.07(3 nm)/Cu(2 nm) structures have been investigated by atomic force microscopy, vibrating sample magnetometer, and ferromagnetic resonance (FMR). The roughness of all films increases with increasing copper thickness, which causes the different grain sizes in the surface of films. The coercivity of FeCo-Gd films increases with increasing thickness of inserted Cu layer while decreases with increasing thickness of Cu capping layer for FeNi-Nd films. FMR linewidth exhibits huge dependence on the thickness of inserted Cu layer for FeCo-Gd films, increasing from 2270 to 3680 Oe, which comes from the additional contribution of effect of the two-magnon scattering. And the thickness of Cu capping layer shows also an influence on FMR linewidth of FeNi-Nd films, increasing from 190 to 320 Oe, which mainly comes from intrinsic FMR linewidth and plus minor inhomogeneous broadening. All of these extrinsic linewidth broadening are related to the interface roughness.

  13. Wet Chemical Synthesis and Screening of Thick Porous Oxide Films for Resistive Gas Sensing Applications

    PubMed Central

    Frenzer, Gerald; Frantzen, Andreas; Sanders, Daniel; Simon, Ulrich; Maier, Wilhelm F.

    2006-01-01

    A method of wet chemical synthesis suitable for high throughput and combinatorial applications has been developed for the synthesis of porous resistive thick-film gas sensors. This method is based on the robot-controlled application of unstable metal oxide suspensions on an array of 64 inter-digital electrodes positioned on an Al2O3 substrate. SnO2, WO3, ZrO2, TiO2, CeO2, In2O3 and Bi2O3 were chosen as base oxides, and were optimised by doping or mixed oxide formation. The parallel synthesis of mixed oxide sensors is illustrated by representative examples. The electrical characteristics and the sensor performance of the films were measured by high-throughput impedance spectroscopy while supplying various test gases (H2, CO, NO, NO2, propene). Data collection, data mining techniques applied and the best potential sensor materials discovered are presented.

  14. Third-sound propagation in thick films of superfluid He-4

    NASA Astrophysics Data System (ADS)

    Jackson, H. W.; Mason, P. V.

    1990-11-01

    Atkins' (1959) basic theory of third sound in thick films of superfluid He-4 is extended here to include a heat source for exciting third sound. A one-dimensional model obeying periodic boundary conditions is developed which can represent a variety of experimentally important configurations. General solutions for the model equations are found which give a complete description of third-sound waves in terms of displacement of the film surface, superfluid velocity, and temperature change as functions of space and time. Algebraic expressions for quantities that occur in general formulas are found for special excitation signals. The structure of third sound is calculated for the first time and the results are found to be inconsistent with previous findings. A direct method for accurately measuring the vaporization coefficient is also presented.

  15. Quasiparticle Transport in Thick Aluminum Films Coupled to Tungsten Transition Edge Sensors

    NASA Astrophysics Data System (ADS)

    Yen, J. J.; Kreikebaum, J. M.; Young, B. A.; Cabrera, B.; Moffatt, R.; Redl, P.; Shank, B.; Brink, P. L.; Cherry, M.; Tomada, A.

    2016-07-01

    We have fabricated and characterized test devices of a new geometry for cryogenic dark matter search superconducting sensors. The modified design uses the same photolithography masks used to fabricate earlier-generation devices, but with the Al and W films deposited in reverse order. This inverted film geometry (Al over W instead of our conventional W over Al) offers a simplified and robust way to dramatically increase the thickness of Al energy-collecting fins coupled to thin W-TESs—tungsten-transition edge sensors. Data are presented from experiments with inverted geometry test devices exposed to X-rays from a NaCl fluorescence source. The results are compared to data obtained with similar devices fabricated in the standard, non-inverted geometry.

  16. Third-sound propagation in thick films of superfluid He-4

    NASA Technical Reports Server (NTRS)

    Jackson, H. W.; Mason, P. V.

    1990-01-01

    Atkins' (1959) basic theory of third sound in thick films of superfluid He-4 is extended here to include a heat source for exciting third sound. A one-dimensional model obeying periodic boundary conditions is developed which can represent a variety of experimentally important configurations. General solutions for the model equations are found which give a complete description of third-sound waves in terms of displacement of the film surface, superfluid velocity, and temperature change as functions of space and time. Algebraic expressions for quantities that occur in general formulas are found for special excitation signals. The structure of third sound is calculated for the first time and the results are found to be inconsistent with previous findings. A direct method for accurately measuring the vaporization coefficient is also presented.

  17. Thickness-dependent structure and properties of SnS2 thin films prepared by atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Seo, Wondeok; Shin, Seokyoon; Ham, Giyul; Lee, Juhyun; Lee, Seungjin; Choi, Hyeongsu; Jeon, Hyeongtag

    2017-03-01

    Tin disulfide (SnS2) thin films were deposited by a thermal atomic layer deposition (ALD) method at low temperatures. The physical, chemical, and electrical characteristics of SnS2 were investigated as a function of the film thickness. SnS2 exhibited a (001) hexagonal plane peak at 14.9° in the X-ray diffraction (XRD) results and an A1g peak at 311 cm‑1 in the Raman spectra. These results demonstrate that SnS2 thin films grown at 150 °C showed a crystalline phase at film thicknesses above 11.2 nm. The crystallinity of the SnS2 thin films was evaluated by a transmission electron microscope (TEM). The X-ray photoelectron spectroscopy (XPS) analysis revealed that SnS2 consisted of Sn4+ and S2‑ valence states. Both the optical band gap and the transmittance of SnS2 decreased as the film thickness increased. The band gap of SnS2 decreased from 3.0 to 2.4 eV and the transmittance decreased from 85 to 32% at a wavelength of 400 nm. In addition, the resistivity of the thin film SnS2 decreased from 1011 to 106 Ω·cm as the film thickness increased.

  18. High critical current YBCO thick films by TFA-MOD process

    NASA Astrophysics Data System (ADS)

    Tokunaga, Yoshitaka; Fuji, Hiroshi; Teranishi, Ryo; Shibata, Junko; Asada, Sigenobu; Honjo, Tetsuji; Izumi, Teruo; Shiohara, Yuh; Iijima, Yasuhiro; Saitoh, Takashi

    2003-10-01

    As a method of the fabrication processes of YBa 2Cu 3O 7- x (YBCO), the metalorganic deposition (MOD) process using metal trifluoroacetete (TFA) is considered to be a strong candidate due to its low cost fabrication process for coated conductors with high Jc. In our previous work, a triple coated film with 1 μm in thickness was fabricated on a CeO 2/IBAD-YSZ layer buffered Hastelloy substrate by optimizing the condition of heat treatments such as P H 2O in the multi-coating method [Physica C 378-381 (2002) 1013]. The Jc value of 1.6 MA/cm 2 (77 K in self-field) in this film patterned 100 μm width and the Ic* value of 153 A/cm-width at 77 K in self-field were achieved. In order to obtain a thicker film with high overall Ic* for 1 cm width, the influence of the heat treatment conditions of P H 2O , P O 2, and the temperature in the MOD process was investigated. Subsequently, a 5 times coated film was obtained on a CeO 2/IBAD-Zr 2Gd 2O 7 layer buffered Hastelloy substrate by optimizing the conditions of heating and dip coating. As a result, the overall transport Ic value was improved to 210 A and Jc value of 1.53 MA/cm 2 was obtained (77 K in self-field).

  19. Degradation of PVC/rPLA Thick Films in Soil Burial Experiment

    NASA Astrophysics Data System (ADS)

    Nowak, Bożena; Rusinowski, Szymon; Chmielnicki, Blazej; Kamińska-Bach, Grażyna; Bortel, Krzysztof

    2016-10-01

    Some of the biodegradable polymers can be blended with a synthetic polymer to facilitate their biodegradation in the environment. The objective of the study was to investigate the biodegradation of thick films of poly(vinyl chloride)/recycled polylactide (PVC/rPLA). The experiments were carried out in the garden soil or in the mixture of garden soil and hydrocarbon-contaminated soil under laboratory conditions. Since it is widely accepted that the biosurfactants secreted by microorganisms enable biotransformation of various hydrophobic substances in the environment, it was assumed that the use of contaminated soil, rich in biosurfactant producing bacteria, may accelerate biodegradation of plastics. After the experimental period, the more noticeable weight loss of polymer films was observed after incubation in the garden soil. However, more pronounced changes in the film surface morphology and chemical structure as well as decrease of tensile strength were observed after incubation of films in the mixture of garden and contaminated soil. It turned out that as a result of competition between two distinct groups of microorganisms present in the mixture of garden and hydrocarbon-contaminated soils the number of microorganisms and their activity were lower than the activity of indigenous microflora of garden soil as well as the amount of secreted biosurfactants towards plastics.

  20. Effect of layer thickness on the superconducting properties in ultrathin Pb films

    NASA Astrophysics Data System (ADS)

    Durajski, A. P.

    2015-09-01

    Recently, superconductivity was found in one atomic layer of Pb film, promising a new field of research where superconductors can be studied on the atomic level. In the presented paper, we report a theoretical study of the superconductivity in ultrathin Pb films consisting of five to ten monolayers. Using the strong coupling Eliashberg formalism we reproduced the experimental values of critical temperature (TC) and we estimated the superconducting energy gap (Δ (0)), thermodynamic critical field (HC) and the specific heat jump at critical temperature (Δ C≤ft({T}{{C}}\\right)\\equiv {C}{{S}}≤ft({T}{{C}}\\right)-{C}{{N}}≤ft({T}{{C}}\\right)) for a wide range of film thicknesses. In these systems, we found an oscillatory behaviour of the above thermodynamic properties modulated by quantum size effects. Moreover, the large values of 2Δ (0){/k}{{B}}{T}{{C}} and Δ C≤ft({T}{{C}}\\right)/{C}{{N}}≤ft({T}{{C}}\\right), and the small values of {T}{{C}}{C}{{N}}≤ft({T}{{C}}\\right)/{H}{{C}}2(0) prove that the thermodynamic properties of Pb films cannot be correctly described using the Bardeen-Cooper-Schrieffer (BCS) theory of superconductivity due to the strong coupling and retardation effects.

  1. Thick optical films for the conduction of optical and infrared radiation

    SciTech Connect

    Bain, C.N.; Gordon, B.A.; Knasel, T.M.; Malinowski, R.L.

    1981-01-01

    Experimental results are presented for the characteristics of thick optical films, which can be used to direct and conduct optical and IR radiation, for the case of light concentration onto solar cells. Incident light is trapped within a thin, flat sheet of transparent material by a diffuse selective surface on the back of the transparent layer, and so directed that total internal reflection occurs, with some of the captured light finding its way back to the photovoltaic cells attached to the back of the layer. A Monte Carlo computer model is used to analyze this system, whose achievable gain depends on layer thickness, trapping material refraction index, and solar cell shape and size. Results indicate that gains of a factor of two in power output are obtainable for the case of sparsely-packed solar cell arrays and lower factors for more densely-packed arrays.

  2. CdS nanofilms: Effect of film thickness on morphology and optical band gap

    NASA Astrophysics Data System (ADS)

    Kumar, Suresh; Kumar, Santosh; Sharma, Pankaj; Sharma, Vineet; Katyal, S. C.

    2012-12-01

    CdS nanofilms of varying thickness (t) deposited by chemical bath deposition technique have been studied for structural changes using x-ray diffractometer (XRD) and transmission electron microscope (TEM). XRD analysis shows polycrystalline nature in deposited films with preferred orientation along (002) reflection plane also confirmed by selected area diffraction pattern of TEM. Uniform and smooth surface morphology observed using field emission scanning electron microscope. The surface topography has been studied using atomic force microscope. The optical constants have been calculated from the analysis of %T and %R spectra in the wavelength range 300 nm-900 nm. CdS nanofilms show a direct transition with red shift. The optical band gap decreases while the refractive index increases with increase in thickness of nanofilms.

  3. Thick-Film Carbon Dioxide Sensor via Anodic Adsorbate Stripping Technique and Its Structural Dependence.

    PubMed

    Photinon, Kanokorn; Wang, Shih-Han; Liu, Chung-Chiun

    2009-01-01

    A three-electrode based CO(2) sensor was fabricated using thick-film technology. The performance of this sensor was further enhanced by incorporating platinum nanoparticles onto the working electrode surface. An eight-fold increase in the signal output was obtained from the electrode with the platinum nanoparticles. The sensing output was linearly related to the CO(2) presented. Stability measurements demonstrated that the decline of the active surface area and the sensitivity of the sensor were 8% and 13%, respectively, over a two week period of time. The sensor response appeared to be a structural dependence of the crystallographic orientation of platinum electrode.

  4. Determining the bubble cap film thickness of bursting bubbles from their acoustic emissions.

    PubMed

    Deane, Grant B

    2013-02-01

    A study of the sound generated by 2.5 mm radius bubbles bursting on the surface of fresh water is presented. The sound pulses are found to be sensitive to the time interval between the bubble reaching the water surface and bursting. Bubbles that burst within a few 10's of milliseconds behave like a Helmholtz resonator and radiate a swept chirp pulse. Bubbles that persist for 100's of milliseconds or more exhibit more complex acoustic behavior. An analysis of the resonator behavior provides an estimate of the film thickness in reasonable agreement with a fluid drainage model.

  5. Determination of lubricant selection based on elastohydrodynamic film thickness and traction measurement

    NASA Technical Reports Server (NTRS)

    Dow, T. A.; Kannel, J. W.

    1979-01-01

    The project was conducted to aid in the development of an elastohydrodynamic specification for military lubricants. Experiments were conducted with a rolling disk apparatus designed to simulate a bearing or gear type contact. Measurements included lubricant film thickness, lubricant breakdown and traction for a range of loads, speeds, temperatures, and surface roughnesses. Several lubricants were used in the investigations including a traction fluid, two synthetic paraffinic lubricants and several lubricants conforming to MIL-L 7808 and 23699 specifications. Recommendations regarding an EHD specification are included.

  6. Deep Impact Delta II Launch Vehicle Cracked Thick Film Coating on Electronic Packages Technical Consultation Report

    NASA Technical Reports Server (NTRS)

    Cameron, Kenneth D.; Kichak, Robert A.; Piascik, Robert S.; Leidecker, Henning W.; Wilson, Timmy R.

    2009-01-01

    The Deep Impact spacecraft was launched on a Boeing Delta II rocket from Cape Canaveral Air Force Station (CCAFS) on January 12, 2005. Prior to the launch, the Director of the Office of Safety and Mission Assurance (OS&MA) requested the NASA Engineering and Safety Center (NESC) lead a team to render an independent opinion on the rationale for flight and the risk code assignments for the hazard of cracked Thick Film Assemblies (TFAs) in the E-packages of the Delta II launch vehicle for the Deep Impact Mission. The results of the evaluation are contained in this report.

  7. Evaluation of eddy-current proximity devices for measuring thin potassium film thicknesses

    NASA Technical Reports Server (NTRS)

    Asadourian, A. S.

    1972-01-01

    Two eddy current proximity probe systems were tested over a range of 0 to 508 micrometers (0 to 20 mils) of simulated potassium film thicknesses for simulated temperatures of 66 C (150 F), 232 C (450 F), and 666 C (1230 F). The results of short time calibration tests are presented. Instrument drift was a problem throughout the testing and, without correction, may limit the use of such systems to short periods of time. Additional development will be required prior to their being usable as practical instrumentation systems.

  8. Modeling the thickness dependence of the magnetic phase transition temperature in thin FeRh films

    NASA Astrophysics Data System (ADS)

    Ostler, Thomas Andrew; Barton, Craig; Thomson, Thomas; Hrkac, Gino

    2017-02-01

    FeRh and its first-order phase transition can open new routes for magnetic hybrid materials and devices under the assumption that it can be exploited in ultra-thin-film structures. Motivated by experimental measurements showing an unexpected increase in the phase transition temperature with decreasing thickness of FeRh on top of MgO, we develop a computational model to investigate strain effects of FeRh in such magnetic structures. Our theoretical results show that the presence of the MgO interface results in a strain that changes the magnetic configuration which drives the anomalous behavior.

  9. Solid state microelectronics tolerant to radiation and high temperature. [JFET thick film hybrids

    NASA Technical Reports Server (NTRS)

    Draper, B. L.; Palmer, D. W.

    1981-01-01

    The 300 C electronics technology based on JFET thick film hybrids was tested up to 10 to the 9th power rad gamma (Si) and 10 to the 15th power neutrons/sq cm. Circuits and individual components from this technology all survived this total dose although some devices required 1 hour of annealing at 200 or 300 C to regain functionality. This technology used with real time annealing should function to levels greater than 10 to the 10th power rad gamma and 10 to the 16th power n/sq cm.

  10. Effects of the rate of evaporation and film thickness on nonuniform drying of film-forming concentrated colloidal suspensions.

    PubMed

    Narita, T; Hébraud, P; Lequeux, F

    2005-05-01

    In this paper, we report on nonuniform distribution of film-forming waterborne colloidal suspensions above the critical concentration phi(c) of the colloidal glass transition during drying. We found that colloidal suspension films dry nonuniformly when the initial rate of evaporation E and/or the initial thickness l(0) are high. We found that a Peclet number Pe, defined as Pe = El(0)/D, where D is the diffusion coefficient of the colloids in the diluted suspensions, does not predict uniformity of drying of the concentrated suspensions, contrary to the reported work on drying of diluted suspensions. Since the colloidal particles are crowded and their diffusive motion is restricted in concentrated suspensions, we assumed that above phi(c) water is transported to the drying surface by hydrodynamic flow along the osmotic pressure gradient. The permeability of water through channels between deforming particles is estimated by adapting the theory of foam drainage. We defined a new Peclet number Pe' by substituting the transport coefficient of flow (defined as the permeability divided by the viscosity, multiplied by the osmotic pressure gradient) for the diffusion coefficient. This extended Peclet number predicted the nonuniform drying with a criterion of Pe' > 1. These results indicate that the mechanism of water transport to the drying surface in concentrated suspensions is water permeation by osmotic pressure, which is faster than mutual diffusion between water and particles --that has been observed in diluted suspensions and discussed by Routh and Russel. The theory fits well the experimental drying curves for various thicknesses and rates of evaporation. The particle distribution in the drying films is also estimated and it is indicated that the latex distribution is nonuniform when Pe' > 1.

  11. Tuning thermoelectricity in a Bi2Se3 topological insulator via varied film thickness

    SciTech Connect

    Guo, Minghua; Wang, Zhenyu; Xu, Yong; Huang, Huaqing; Zang, Yunyi; Liu, Chang; Duan, Wenhui; Gan, Zhongxue; Zhang, Shou-Cheng; He, Ke; Ma, Xucun; Xue, Qikun; Wang, Yayu

    2016-01-12

    We report thermoelectric transport studies on Bi2Se3 topological insulator thin films with varied thickness grown by molecular beam epitaxy. We find that the Seebeck coefficient and thermoelectric power factor decrease systematically with the reduction of film thickness. These experimental observations can be explained quantitatively by theoretical calculations based on realistic electronic band structure of the Bi2Se3 thin films. Lastly, this work illustrates the crucial role played by the topological surface states on the thermoelectric transport of topological insulators, and sheds new light on further improvement of their thermoelectric performance.

  12. Effect of Catalyst Film Thickness on Growth Morphology, Surface Wettability and Drag Reduction Property of Carbon Nanotubes

    NASA Astrophysics Data System (ADS)

    Ma, Weiwei; Zhou, Zhiping; Li, Gang; Li, Ping

    2016-10-01

    Nickel films were deposited on silicon substrates using magnetron sputtering method. The pretreatment process of nickel films under high temperature and ammonia atmosphere was investigated. The thickness of nickel film has a great influence on growth morphology of carbon nanotubes (CNTs). Too large or too small thickness would do harm to the orientated growth of CNTs. The inner structure, elements composition and growth mechanism have been confirmed by TEM and EDX characterization. The surface wettability and drag reduction property of CNTs were investigated. This paper can provide a new, effective method to further develop the practical application in micro/nano devices field.

  13. Fabrication of TiO{sub 2} Thick Film for Photocatalyst from Commercial TiO{sub 2} Powder

    SciTech Connect

    Asteti, S. Fuji; Syarif, D. Gustaman

    2008-03-17

    Photocatalytic activity of TiO{sub 2} thick film ceramics made of commercial TiO{sub 2} powder has been studied. The TiO{sub 2} powder was nano sized one that was derived from dried TiO{sub 2} suspension. The TiO{sub 2} suspension was made by pouring some blended commercial TiO{sub 2} powder into some amount of water. The paste of TiO{sub 2} was made by mixing the nano sized TiO{sub 2} powder with organic vehicle and glass frit. The paste was spread on a glass substrate. The paste was dried at 100 deg. C and heated at different temperatures (400 deg. C and 500 deg. C) for 60 minutes to produce thick film ceramics. The photocatalytic activity of these films was evaluated by measuring the concentration of a solution of methylene blue where the thick films were inside after being illuminated by UV light at various periods of times. The initial concentration of the methylene blue solution was 5 ppm. Structural analyses were carried out by X-ray diffraction (XRD). The XRD analyses showed that the produced thick film ceramic had mainly crystal structure of anatase. According to the photocatalytical data, it was known that the produced thick film ceramics were photocatalyst which were capable of decomposing an organic compound such as the methylene blue.

  14. Anomalous thickness-dependent optical energy gap of ALD-grown ultra-thin CuO films

    NASA Astrophysics Data System (ADS)

    Tripathi, T. S.; Terasaki, I.; Karppinen, M.

    2016-11-01

    Usually an inverse square relation between the optical energy gap and the size of crystallites is observed for semiconducting materials due to the strong quantum localization effect. Coulomb attraction that may lead to a proportional dependence is often ignored or considered less important to the optical energy gap when the crystallite size or the thickness of a thin film changes. Here we report a proportional dependence between the optical energy gap and the thickness of ALD-grown CuO thin films due to a strong Coulomb attraction. The ultrathin films deposited in the thickness range of 9-81 nm show a p-type semiconducting behavior when analyzed by Seebeck coefficient and electrical resistivity measurements. The indirect optical energy gap nature of the films is verified from UV-vis spectrophotometric measurements. A progressive increase in the indirect optical energy gap from 1.06 to 1.24 eV is observed with the increase in the thickness of the films. The data are analyzed in the presence of Coulomb attractions using the Brus model. The optical energy gap when plotted against the cubic root of the thickness of the films shows a linear dependence.

  15. Film Thickness Determines Cell Growth and Cell Sheet Detachment from Spin-Coated Poly(N-Isopropylacrylamide) Substrates.

    PubMed

    Dzhoyashvili, Nina A; Thompson, Kerry; Gorelov, Alexander V; Rochev, Yuri A

    2016-10-04

    Poly(N-isopropylacrylamide) (pNIPAm) is widely used to fabricate thermoresponsive surfaces for cell sheet detachment. Many complex and expensive techniques have been employed to produce pNIPAm substrates for cell culture. The spin-coating technique allows rapid fabrication of pNIPAm substrates with high reproducibility and uniformity. In this study, the dynamics of cell attachment, proliferation, and function on non-cross-linked spin-coated pNIPAm films of different thicknesses were investigated. The measurements of advancing contact angle revealed increasing contact angles with increasing film thickness. Results suggest that more hydrophilic 50 and 80 nm thin pNIPAm films are more preferable for cell sheet fabrication, whereas more hydrophobic 300 and 900 nm thick spin-coated pNIPAm films impede cell attachment. These changes in cell behavior were correlated with changes in thickness and hydration of pNIPAm films. The control of pNIPAm film thickness using the spin-coating technique offers an effective tool for cell sheet-based tissue engineering.

  16. Magneto-optical Kerr effect in Fe21Ni79 films on Si(100): Quantum behavior for film thicknesses below ˜6 nm

    NASA Astrophysics Data System (ADS)

    Talmadge, J. M.; Gao, J.; Riley, M. P.; Roth, R. J.; Kim, S.-O.; Eden, J. G.; Pudonin, F. A.; Mel'nikov, I. V.

    2004-05-01

    The magneto-optical Kerr effect (MOKE) has been observed and characterized in 1-80 nm thick Fe21Ni79 films deposited onto Si(100), for an external magnetic field (variable in strength up to 400 G) oriented parallel or orthogonal to the magnetization axis of the film. A measurable response is observed for film thicknesses (d) as small as 2 nm and, if the external magnetic field lies in the plane of the film, two-dimensional quantum behavior is evident for d≲6 nm. A precipitous decline in the magnitude of the MOKE response is accompanied by an increase in the coercivity and, when the external field is perpendicular to the film magnetization axis, a rapid rise in the saturation field. Experiments also confirm the existence of a component of the film magnetization oriented out of the plane of the film, a result consistent with the prediction of computational studies [T. Trunk et al., J. Appl. Phys. 89, 7606 (2001)] that the transition between Bloch and Néel wall domain structure occurs in FeNi films for film thicknesses of ≈30 nm.

  17. Improvement of Flame-made ZnO Nanoparticulate Thick Film Morphology for Ethanol Sensing

    PubMed Central

    Liewhiran, Chaikarn; Phanichphantandast, Sukon

    2007-01-01

    ZnO nanoparticles were produced by flame spray pyrolysis using zinc naphthenate as a precursor dissolved in toluene/acetonitrile (80/20 vol%). The particles properties were analyzed by XRD, BET. The ZnO particle size and morphology was observed by SEM and HR-TEM revealing spheroidal, hexagonal, and rod-like morphologies. The crystallite sizes of ZnO spheroidal and hexagonal particles ranged from 10-20 nm. ZnO nanorods were ranged from 10-20 nm in width and 20-50 nm in length. Sensing films were produced by mixing the nanoparticles into an organic paste composed of terpineol and ethyl cellulose as a vehicle binder. The paste was doctor-bladed onto Al2O3 substrates interdigitated with Au electrodes. The morphology of the sensing films was analyzed by optical microscopy and SEM analysis. Cracking of the sensing films during annealing process was improved by varying the heating conditions. The gas sensing of ethanol (25-250 ppm) was studied at 400 °C in dry air containing SiC as the fluidized particles. The oxidation of ethanol on the surface of the semiconductor was confirmed by mass spectroscopy (MS). The effect of micro-cracks was quantitatively accounted for as a provider of extra exposed edges. The sensitivity decreased notably with increasing crack of sensing films. It can be observed that crack widths were reduced with decreasing heating rates. Crack-free of thick (5 μm) ZnO films evidently showed higher sensor signal and faster response times (within seconds) than cracked sensor. The sensor signal increased and the response time decreased with increasing ethanol concentration.

  18. What is the copper thin film thickness effect on thermal properties of NiTi/Cu bi-layer?

    NASA Astrophysics Data System (ADS)

    Fazeli, Sara; Vahedpour, Morteza; Khatiboleslam Sadrnezhaad, Sayed

    2017-02-01

    Molecular dynamics (MD) simulation was used to study of thermal properties of NiTi/Cu. Embedded atom method (EAM) potentials for describing of inter-atomic interaction and Nose–Hoover thermostat and barostat are employed. The melting of the bi-layers was considered by studying the temperature dependence of the cohesive energy and mean square displacement. To highlight the differences between bi-layers with various copper layer thickness, the effect of copper film thickness on thermal properties containing the cohesive energy, melting point, isobaric heat capacity and latent heat of fusion was estimated. The results show that thermal properties of bi-layer systems are higher than that of their corresponding of pure NiTi. But, these properties of bi-layer systems approximately are independent of copper film thicknesses. The mean square displacement (MSD) results show that, the diffusion coefficients enhance upon increasing of copper film thickness in a linear performance.

  19. Implementation of a Thick-Film Composite Li-Ion Microcathode Using Carbon Nanotubes as the Conductive Filler

    NASA Technical Reports Server (NTRS)

    Lin, Qian; Harb, John N.

    2004-01-01

    This paper describes the development of a thick-film microcathode for use in Li-ion microbatteries in order to provide increased power and energy per area. These cathodes take advantage of a composite porous electrode structure, utilizing carbon nanotubes (CNT) as the conductive filler. The use of carbon nanotubes was found to significantly reduce the measured resistance of the electrodes, increase active material accessibility, and improve electrode performance. In particular, the cycling and power performance of the thick-film cathodes was significantly improved, and the need for compression was eliminated. Cathode thickness and CNT content were optimized to maximize capacity and power performance. Power capability of >50 mW/sq cm (17 mA/sq cm) with discharge capacity of >0.17 mAh/sq cm was demonstrated. The feasibility of fabricating thick-film microcathodes capable of providing the power and capacity needed for use in autonomous microsensor systems was also demonstrated.

  20. Characterization of the optical constants and dispersion parameters of chalcogenide Te40Se30S30 thin film: thickness effect

    NASA Astrophysics Data System (ADS)

    Abd-Elrahman, M. I.; Hafiz, M. M.; Qasem, Ammar; Abdel-Rahim, M. A.

    2016-02-01

    Chalcogenide Te40Se30S30 thin films of different thickness (100-450 nm) are prepared by thermal evaporation of the Te40Se30S30 bulk. X-ray examination of the film shows some prominent peaks relate to crystalline phases indicating the crystallization process. The calculated particles of crystals from the X-ray diffraction peaks are found to be from 11 to 26 nm. As the thickness increases, the transmittance decreases and the reflectance increases. This could be attributed to the increment of the absorption of photons as more states will be available for absorbance in the case of thicker films. The decrease in the direct band gap with thickness is accompanied with an increase in energy of localized states. The obtained data for the refractive index could be fit to the dispersion model based on the single oscillator equation. The single-oscillator energy decreases, while the dispersion energy increases as the thickness increases.

  1. Irreversible properties of YBCO thick films deposited by liquid phase epitaxy on single crystalline substrates

    NASA Astrophysics Data System (ADS)

    Vostner, A.; Tönies, S.; Weber, H. W.; Cheng, Y. S.; Kurumovic, A.; Evetts, J. E.; Mennema, S. H.; Zandbergen, H. W.

    2003-10-01

    We report on the field and temperature dependence of the critical transport current density Jc, the angular dependence of the transport current at various external magnetic fields and the irreversibility fields in YBa2Cu3O7-delta (Y-123) thick films prepared by liquid phase epitaxy (LPE). A comparison of the irreversible properties between specimens produced with and without silver additions to the melt is also presented. Transmission electron microscopy (TEM) was employed to obtain information on the correlation between the transport properties and the microstructure. The samples were deposited either directly on NdGaO3 (NGO) or on seeded (100) MgO substrates, where a 200 nm thin YBCO film deposited by pulsed laser deposition (PLD) acts as seed layer for the LPE process. The final thickness of the Y-123 layer is of the order of 1 µm for the NGO and between 2 and 10 µm for the MgO samples. The critical current densities reach 3 × 109 A m-2 at zero field and 77 K in the best case.

  2. Refractive index, sound velocity and thickness of thin transparent films from multiple angles picosecond ultrasonics

    SciTech Connect

    Cote, R.; Devos, A.

    2005-05-15

    We present a method for refractive indices and longitudinal sound velocity measurements from picosecond ultrasonic experiments made at different probe incidence angles. For transparent or semitransparent materials such as dielectrics or semiconductors, picosecond ultrasonic experiments can lead to oscillations in the reflectivity curves whose frequency depends on the refractive indices, the sound velocity and the experiments angle. From these data we establish a simple method for the calculation of the refractive indices and verify it on a GaAs sample. We show on fluorinated silica glass and aluminum nitride practical applications of this method on thin films. From two experiments we measure the refraction index and the sound velocity of these materials, with no assumption on the materials properties or on the sample layers' thicknesses. Here the materials are buried under a thin aluminum film. It illustrates the fact that the method can be applied to multilayers. From the same experiments we then derive the thickness of the layers. It shows that this method can render picosecond ultrasonic experiments independent from other characterization means.

  3. Copper thick film sintering studies in an environmental scanning electron microscope.

    PubMed

    Link, L F; Gerristead, W R; Tamhankar, S

    1993-08-01

    The significance of the ElectroScan environmental scanning electron microscope (ESEM) as a processing tool for studying dynamic morphological changes under controlled temperature/atmosphere conditions was evaluated. The ability to observe dynamic processes in situ, which cannot be achieved by other means, is critical to understanding microstructural formation. Processing of printed copper thick films on ceramics was used as a test case, wherein morphological changes associated with the steps of organic binder removal and sintering of copper particles were observed/examined in real time. Good agreement was seen between microstructures obtained in the ESM and those achieved in a belt furnace when similar process variables were used. When processed in atmospheres which were proven to induce sintering in a conventional belt furnace, sintering was evident in both cases, and the microstructural changes were documented on video-tapes in real time. Determination of critical event temperatures was achieved--that is, binder burnout occurring between 270 degrees and 350 degrees C, onset of oxidation at 520 degrees C, and sintering starting at 770 degrees C. It was thus verified that the microstructural changes during the copper thick film sintering process can be observed in situ using an ESEM.

  4. Development of a dimethyl ether (DME) sensor using platinum nanoparticles and thick-film printing.

    PubMed

    Photinon, Kanokorn; Wang, Shih-Han; Liu, Chung Chiun

    2006-10-15

    A portable and cost-effective technique to measure the dimethyl ether (DME) concentrations has been developed. It is based on an electrochemical principle measuring the oxidation current of DME at an applied potential of +0.2V versus a Ag/AgCl reference electrode. Thick-film printing technique is used for the fabrication of this DME sensor, and platinum nanoparticles in the crystallite size of 5.5 nm are used for the modification of the working electrode surface. This modification enhances the sensor performance significantly leading to a higher sensitivity of the sensor comparing to bare platinum electrode. Evaluation and characterization of this sensor are carried out over the DME concentration range of 0-7% (v/v), and a linear relationship between sensor outputs and the DME concentrations with an average R(2) of 0.996 exists. The reproducibility of the sensor is also very good. This electrochemically based DME sensor fabricated by thick-film screen printing technique and using the platinum nanoparticles to enhance its performance will be valuable and practical for the estimation of the airway mucosal blood flow.

  5. Bacterial flagellar motility on hydrated rough surfaces controlled by aqueous film thickness and connectedness

    PubMed Central

    Tecon, Robin; Or, Dani

    2016-01-01

    Recent studies have shown that rates of bacterial dispersion in soils are controlled by hydration conditions that define size and connectivity of the retained aqueous phase. Despite the ecological implications of such constraints, microscale observations of this phenomenon remain scarce. Here, we quantified aqueous film characteristics and bacterial flagellated motility in response to systematic variations in microhydrological conditions on porous ceramic surfaces that mimic unsaturated soils. We directly measured aqueous film thickness and documented its microscale heterogeneity. Flagellar motility was controlled by surface hydration conditions, as cell velocity decreased and dispersion practically ceased at water potentials exceeding –2 kPa (resulting in thinner and disconnected liquid films). The fragmentation of aquatic habitats was delineated indirectly through bacterial dispersal distances within connected aqueous clusters. We documented bacterial dispersal radii ranging from 100 to 10 μm as the water potential varied from 0 to –7 kPa, respectively. The observed decrease of flagellated velocity and dispersal ranges at lower matric potentials were in good agreement with mechanistic model predictions. Hydration-restricted habitats thus play significant role in bacterial motility and dispersal, which has potentially important impact on soil microbial ecology and diversity. PMID:26757676

  6. Microstructure and Magnetic Properties of the Aerosol-Deposited Sm-Fe-N Thick Films

    NASA Astrophysics Data System (ADS)

    Maki, Tomohito; Sugimoto, Satoshi; Kagotani, Toshio; Inomata, Koichiro; Akedo, Jun

    In this study, the relationship among magnetic properties, Aerosol Deposition (AD) conditions and microstructures in Sm-Fe-N AD films were investigated. The maximum thickness of 145 μm was obtained in the AD conditions of gas flow rate (gfr) = 6 L/min for 10 min. The density of Sm-Fe-N films were in the range of 5.43 - 6.24 g/cm3, which were 71 - 81 % of the X-ray density of the Sm2Fe17N3 compound reported (7.67 g/cm3). The Sm-Fe-N AD films showed remanence in the range of 0.38 - 0.42 T, which were 61 - 68 % of that of Sm-Fe-N host powder (0.62 T). The coercivities increased from 1.16 to 1.74 - 1.79 T after the deposition because the grain size decreased from 1.94 to 0.32 μm.

  7. Enhancement of thickness uniformity of thin films grown by pulsed laser deposition

    NASA Technical Reports Server (NTRS)

    Fernandez, Felix E.

    1995-01-01

    A peculiarity of the pulsed laser deposition technique of thin-film growth which limits its applicability is the very rapid drop of resulting film thickness as a function of distance from the deposition axis. This is due to the narrow forward peaking of the emission plume characteristic of the laser ablation process. The plume is usually modeled by a cos(sup n) theta function with n greater, and in some cases, much higher, than 1. Based on this behavior, a method is presented to substantially enhance coverage uniformity in substrate zones of the order of the target-substrate distance h, and to within a specified thickness tolerance. Essentially, target irradiation is caused to form an annular emission source instead of the usual spot. By calculating the resulting thickness profiles, an optimum radius s is found for the annular source, corresponding to a given power in the emission characteristic and a given value of h. The radius of this annulus scales with h. Calculated numerical results for optimal s/h ratios corresponding to a wide range of values for n are provided for the case of +/- 1% tolerance in deviation from the thickness at deposition axis. Manners of producing annular illumination of the target by means of conic optics are presented for the case of a laser beam with radially symmetric profile. The region of uniform coverage at the substrate can be further augmented by extension of the method to multiple concentric annular sources. By using a conic optic of novel design, it is shown also how a single-laser beam can be focused onto a target in the required manner. Applicability of the method would be limited in practice by the available laser power. On the other hand, the effective emitting area can be large, which favors extremely high growth rates, and since growth can occur uniformly over the whole substrate for each laser pulse, single-shot depositions with substantial thicknesses are possible. In addition, the simultaneity of growth over the

  8. Electroplated L1{sub 0} CoPt thick-film permanent magnets

    SciTech Connect

    Oniku, Ololade D. Qi, Bin; Arnold, David P.

    2014-05-07

    The fabrication and magnetic characterization of 15-μm-thick electroplated L1{sub 0} CoPt hard magnets with good magnetic properties is reported in this paper. Experimental study of the dependence of the magnets' properties on annealing temperature reveals that an intrinsic coercivity H{sub ci} = ∼800 kA/m (10 kOe), squareness >0.8, and energy product of >150 kJ/m{sup 3} are obtained for photolithographically patterned structures (250 μm × 2 mm stripes; 15 μm thickness) electroplated on silicon substrates and annealed in hydrogen forming gas at 700 °C. Scanning electron microscopy is used to inspect the morphology of both the as-deposited and annealed magnetic layers, and X-ray Diffractometer analysis on the magnets annealed at 700 °C confirm a phase transformation to an ordered L1{sub 0} CoPt structure, with a minor phase of hcp Co. These thick films are intended for microsystems/MEMS applications.

  9. Thickness controlled sol-gel silica films for plasmonic bio-sensing devices

    NASA Astrophysics Data System (ADS)

    Figus, Cristiana; Quochi, Francesco; Artizzu, Flavia; Saba, Michele; Marongiu, Daniela; Floris, Francesco; Marabelli, Franco; Patrini, Maddalena; Fornasari, Lucia; Pellacani, Paola; Valsesia, Andrea; Mura, Andrea; Bongiovanni, Giovanni

    2014-10-01

    Plasmonics has recently received considerable interest due to its potentiality in many fields as well as in nanobio-technology applications. In this regard, various strategies are required for modifying the surfaces of plasmonic nanostructures and to control their optical properties in view of interesting application such as bio-sensing, We report a simple method for depositing silica layers of controlled thickness on planar plasmonic structures. Tetraethoxysilane (TEOS) was used as silica precursor. The control of the silica layer thickness was obtained by optimizing the sol-gel method and dip-coating technique, in particular by properly tuning different parameters such as pH, solvent concentration, and withdrawal speed. The resulting films were characterized via atomic force microscopy (AFM), Fourier-transform (FT) spectroscopy, and spectroscopic ellipsometry (SE). Furthermore, by performing the analysis of surface plasmon resonances before and after the coating of the nanostructures, it was observed that the position of the resonance structures could be properly shifted by finely controlling the silica layer thickness. The effect of silica coating was assessed also in view of sensing applications, due to important advantages, such as surface protection of the plasmonic structure.

  10. Structural, morphological, optical and electrical properties of NiO films prepared on Si (100) and glass substrates at different thicknesses

    NASA Astrophysics Data System (ADS)

    Ahmed, Anas A.; Afzal, Naveed; Devarajan, Mutharasu; Subramani, Shanmugan

    2016-11-01

    In this work, structural, surface, optical and electrical properties of NiO films were studied at different film thicknesses. The NiO films of different thicknesses in the range 330-920 nm were prepared on Si (100) and glass substrates by using radiofrequency magnetron sputtering of NiO target at 100 °C. The structural study through XRD indicated polycrystalline NiO films with preferred orientation along (200) plane. The crystalline quality of the films was improved with increase of the film thickness on both substrates, however, the films prepared on Si (100) displayed better crystallinity as compared to the films prepared on the glass. The morphological features of the film as studied through FE-SEM displayed an increase of grain size with increase of its thickness, however, the grain size of the film on Si (100) was found to be slightly larger than that of the glass. The band gap of NiO film was decreased with increase of the film thickness on both the substrates. The films grown on Si (100) exhibited superior electrical properties as compared to the films prepared on glass at all film thicknesses.

  11. Water-in-model oil emulsions studied by small-angle neutron scattering: interfacial film thickness and composition.

    PubMed

    Verruto, Vincent J; Kilpatrick, Peter K

    2008-11-18

    The ever-increasing worldwide demand for energy has led to the upgrading of heavy crude oil and asphaltene-rich feedstocks becoming viable refining options for the petroleum industry. Traditional problems associated with these feedstocks, particularly stable water-in-petroleum emulsions, are drawing increasing attention. Despite considerable research on the interfacial assembly of asphaltenes, resins, and naphthenic acids, much about the resulting interfacial films is not well understood. Here, we describe the use of small-angle neutron scattering (SANS) to elucidate interfacial film properties from model emulsion systems. Modeling the SANS data with both a polydisperse core/shell form factor as well as a thin sheet approximation, we have deduced the film thickness and the asphaltenic composition within the stabilizing interfacial films of water-in-model oil emulsions prepared in toluene, decalin, and 1-methylnaphthalene. Film thicknesses were found to be 100-110 A with little deviation among the three solvents. By contrast, asphaltene composition in the film varied significantly, with decalin leading to the most asphaltene-rich films (30% by volume of the film), while emulsions made in toluene and methylnaphthalene resulted in lower asphaltenic contents (12-15%). Through centrifugation and dilatational rheology, we found that trends of decreasing water resolution (i.e., increasing emulsion stability) and increasing long-time dilatational elasticity corresponded with increasing asphaltene composition in the film. In addition to the asphaltenic composition of the films, here we also deduce the film solvent and water content. Our analyses indicate that 1:1 (O/W) emulsions prepared with 3% (w/w) asphaltenes in toluene and 1 wt % NaCl aqueous solutions at pH 7 and pH 10 resulted in 80-90 A thick films, interfacial areas around 2600-3100 cm (2)/mL, and films that were roughly 25% (v/v) asphaltenic, 60-70% toluene, and 8-12% water. The increased asphaltene and water film

  12. Influence of film thickness in THz active metamaterial devices: A comparison between superconductor and metal split-ring resonators

    NASA Astrophysics Data System (ADS)

    Singh, Ranjan; Roy Chowdhury, Dibakar; Xiong, Jie; Yang, Hao; Azad, Abul K.; Taylor, Antoinette J.; Jia, Q. X.; Chen, Hou-Tong

    2013-08-01

    We experimentally demonstrate thickness-dependent resonance tuning in planar terahertz superconducting metamaterials. Inductive-capacitive resonance of arrays of split-ring resonators fabricated from 50, 100, and 200 nm thick YBa2Cu3O7-δ (YBCO) and gold films were characterized and compared as a function of temperature. In the YBCO metamaterials the resonance frequency strongly depends on the thickness, and they show high thermal tunability in both resonance strength and frequency below the superconducting transition temperature, where the imaginary conductivity varies by three orders of magnitude. In contrast, the resonance in the gold metamaterials exhibits little thickness-dependence and very small tunability.

  13. X-ray diffraction studies of trilayer oscillations in the preferred thickness of In films on Si(111)

    NASA Astrophysics Data System (ADS)

    Gray, A.; Liu, Y.; Hong, Hawoong; Chiang, T.-C.

    2013-05-01

    We report a surface x-ray diffraction study of the structure of In films grown on Si(111)-(7×7) and Si(111)-(3×3)-In substrates at a low temperature (135 K). The (7×7) reconstruction of the clean Si(111) surface is found to persist upon burial by the In. X-ray reflectivity measurements yield patterns that deviate strongly from the ideal case; the results suggest a complex In film structure, possibly distorted by the corrugated interfacial reconstruction. By contrast, In films grown on the Si(111)-(3×3)-In surface exhibit reflectivity data that are much closer to the ideal case. The films are found to grow approximately layer by layer, resulting in a relatively small roughness. Upon annealing, the films develop preferred thicknesses at 10, 13, and 16 monolayers (MLs). Previous photoemission studies revealed preferred thicknesses at 4 and 7 MLs. Putting these results together, the preferred thickness sequence, 4, 7, 10, 13, and 16 ML, establishes a trilayer oscillation period. This period is expected from the known electronic structure of In, and arises from quantum confinement of the In valence electrons. This is the second example, after the well-known bilayer period in Pb, which shows quantum oscillations over a wide range of film thickness.

  14. Cross-sectional nanoindentation (CSN) studies on the effect of thickness on adhesion strength of thin films

    NASA Astrophysics Data System (ADS)

    Roshanghias, A.; Khatibi, G.; Pelzer, R.; Steinbrenner, J.; Bernardi, J.

    2015-01-01

    In this study the cross-sectional nanoindentation (CSN) technique has been employed to investigate the adhesion behavior of Titanium-Tungsten (TiW) thin films in various thicknesses on silicon substrate. Furthermore, the nanoindentation-induced blister (NIB) technique has been implemented on the same samples to evaluate the adhesion energy of the films with a different approach. The adhesion energy release rate of these thin films, derived by these two techniques, revealed a good agreement. Accordingly, the results show that as the thickness of the TiW layer increases, the adhesion toughness of the film decreases. It was suggested that three factors might be responsible for the superior adhesion strength of thin films with lower thicknesses: higher surface energy due to the smaller mean grain size; higher constraint from the substrate, which causes inferior fracture toughness of the coating and facilitates crack deflection from interface to surface; and, energy dissipation due to decohesion. The thickness dependency of the transition between delamination and decohesion mechanism in thin films has also been discussed and modelled.

  15. Thick REBaCuO superconducting films through single-coating of low-fluorine metallorganic solution

    NASA Astrophysics Data System (ADS)

    Boubeche, M.; Cai, C. B.; Jian, H. B.; Li, M. J.; Yang, W. T.; Liu, Z. Y.; Bai, C. Y.

    2016-10-01

    A high critical current Ic is crucial for the application of high temperature superconductors YBa2Cu3O7-δ in energy efficient power devices and wires. In this paper we report the fabrication of thick (YGd)1.3Ba2Cu3O7-x films on a metal substrate using low-fluorine metal organic deposition method. The effects of the film thickness on the microstructure, texture and superconductivity properties of the films were evaluated. In order to increase the film thicknesses by single coating, the influence of withdrawal speed during the dip coating on resulting thickness are investigated with the other processing parameters fixed. It is revealed that there is a maximum thickness for a certain starting solution. Here we used 3 different solutions, Conventional Low Fluorine solutions with 2 M and 2.5 M, and super low-fluorine solution with 2.5 M. The maximum thicknesses of about 710 nm, 1280 nm and 1460 nm were obtained, respectively.

  16. Effects of mechanical properties of polymer on ceramic-polymer composite thick films fabricated by aerosol deposition.

    PubMed

    Kwon, Oh-Yun; Na, Hyun-Jun; Kim, Hyung-Jun; Lee, Dong-Won; Nam, Song-Min

    2012-05-22

    Two types of ceramic-polymer composite thick films were deposited on Cu substrates by an aerosol deposition process, and their properties were investigated to fabricate optimized ceramic-based polymer composite thick films for application onto integrated substrates with the advantage of plasticity. When polymers with different mechanical properties, such as polyimide (PI) and poly(methyl methacrylate) (PMMA), are used as starting powders together with α-Al2O3 powder, two types of composite films are formed with different characteristics - surface morphologies, deposition rates, and crystallite size of α-Al2O3. Through the results of micro-Vickers hardness testing, it was confirmed that the mechanical properties of the polymer itself are associated with the performances of the ceramic-polymer composite films. To support and explain these results, the microstructures of the two types of polymer powders were observed after planetary milling and an additional modeling test was carried out. As a result, we could conclude that the PMMA powder is distorted by the impact of the Al2O3 powder, so that the resulting Al2O3-PMMA composite film had a very small amount of PMMA and a low deposition rate. In contrast, when using PI powder, the Al2O3-PI composite film had a high deposition rate due to the cracking of PI particles. Consequently, it was revealed that the mechanical properties of polymers have a considerable effect on the properties of the resulting ceramic-polymer composite thick films.

  17. Fabrication and Properties of Bulk and Thick Film YTTRIUM(1) BARIUM(2) COPPER(3) OXYGEN(7-DELTA) Superconductors

    NASA Astrophysics Data System (ADS)

    Bailey, Andrew

    Many of the applications envisaged for the new high critical temperature cuprate superconductors require the ability to produce high quality material in layers of 1-100mum thickness which can be used as prepared, or after patterning into discrete forms. Among the possible applications in the foreseeable future are EMI/EMC shielding, pcb interconnects, inductances, stripline, mixers and resonators. Consequently it is important to establish methods of 'thick film' manufacture which provide the versatility necessary for the wide range of uses. During the course of this research, a variety of processing methods have been studied in an attempt to optimize the important film parameters of density, adhesion, strength and good stable superconducting characteristics. Details will be given of substrate-layer interaction for the various substrates that were studied, which included alumina, sapphire, single crystal (100)MgO and yttria stabilised zirconia together with a number of methods of substrate passivation. To date, the most successful substrate for Y_1Ba_2Cu_3O_{7-delta } thick film production has been yttria stabilised zirconia. This thesis will discuss the results of investigations, using yttria stabilised zirconia substrates, which have identified satisfactory means of obtaining superconducting layers with T_{c} = 91.5K and J_{c~ }3000 Acm^{-2} in zero applied magnetic field. At the time of writing, this value of critical current density remains the highest reported value for Y_1Ba_2Cu _3O_{7-delta} thick films. These high quality thick films were then used in a study of conduction mechanisms and the results are interpreted in terms of flux pinning and thermodynamic fluctuation theory. These results highlighted the complex nature of the conduction process in these new ceramics, which is dominated by the weak-link intergranular contacts. Finally, details are given of Josephson characteristics that were observed in variable thickness microbridges patterned into the

  18. Strain relaxation in nm-thick Cu and Cu-alloy films bonded to a rigid substrate

    NASA Astrophysics Data System (ADS)

    Herrmann, Ashley Ann Elizabeth

    In the wide scope of modern technology, nm-thick metallic films are increasingly used as lubrication layers, optical coatings, plating seeds, diffusion barriers, adhesion layers, metal contacts, reaction catalyzers, etc. A prominent example is the use of nm-thick Cu films as electroplating seed layers in the manufacturing of integrated circuits (ICs). These high density circuits are linked by on-chip copper interconnects, which are manufactured by filling Cu into narrow trenches by electroplating. The Cu fill by electroplating requires a thin Cu seed deposited onto high-aspect-ratio trenches. In modern ICs, these trenches are approaching 10 nm or less in width, and the seed layers less than 1 nm in thickness. Since nm-thick Cu seed layers are prone to agglomeration or delamination, achieving uniform, stable and highly-conductive ultra-thin seeds has become a major manufacturing challenge. A fundamental understanding of the strain behavior and thermal stability of nm-thick metal films adhered to a rigid substrate is thus critically needed. In this study, we focus on understanding the deformation modes of nm-thick Cu and Cu-alloy films bonded to a rigid Si substrate and under compressive stress. The strengthening of Cu films through alloying is also studied. In-situ transport measurements are used to monitor the deformation of such films as they are heated from room temperature to 400 °C. Ex-situ AFM is then used to help characterize the mode of strain relaxation. The relaxation modes are known to be sensitive to the wetting and adhesive properties of the film-substrate interface. We use four different liners (Ta, Ru, Mo and Co), interposed between the film and substrate to provide a wide range of interfacial properties to study their effect on the film's thermal stability. Our measurements indicate that when the film/liner interfacial energy is low, grain growth is the dominant relaxation mechanism. As the interface energy increases, grain growth is suppressed, and

  19. Enhanced selectivity of boron doped diamond electrodes for the detection of dopamine and ascorbic acid by increasing the film thickness

    NASA Astrophysics Data System (ADS)

    Qi, Yao; Long, Hangyu; Ma, Li; Wei, Quiping; Li, Site; Yu, Zhiming; Hu, Jingyuan; Liu, Peizhi; Wang, Yijia; Meng, Lingcong

    2016-12-01

    In this paper, boron doped diamond (BDD) with different thickness were prepared by hot filament chemical vapor deposition. The performance of BDD electrodes for detecting dopamine (DA) and ascorbic acid (AA) were investigated. Scanning electron microscopy and Raman spectra reveal the grain size increases and the film quality improves with the increase of film thickness. Electrochemical test show that the transfer coefficient in [Fe3 (CN) 6]3-/4- redox system increases with the increase of the film thickness. The results of selectivity and sensitivity for DA mixed with AA detection show that 8h-BDD and 12h-BDD electrodes possess well selective separated oxidation peaks of DA and AA, and the 12h-BDD electrode exhibits optimal sensitivity until the DA concentration drops to 1 μ M.

  20. Discrete component bonding and thick film materials study. [of capacitor chips bonded with solders and conductive epoxies

    NASA Technical Reports Server (NTRS)

    Kinser, D. L.

    1976-01-01

    The bonding reliability of discrete capacitor chips bonded with solders and conductive epoxies was examined along with the thick film resistor materials consisting of iron oxide phosphate and vanadium oxide phosphates. It was concluded from the bonding reliability studies that none of the wide range of types of solders examined is capable of resisting failure during thermal cycling while the conductive epoxy gives substantially lower failure rates. The thick film resistor studies proved the feasibility of iron oxide phosphate resistor systems although some environmental sensitivity problems remain. One of these resistor compositions has inadvertently proven to be a candidate for thermistor applications because of the excellent control achieved upon the temperature coefficient of resistance. One new and potentially damaging phenomenon observed was the degradation of thick film conductors during the course of thermal cycling.

  1. Wrinkling of a stiff thin film bonded to a pre-strained, compliant substrate with finite thickness

    NASA Astrophysics Data System (ADS)

    Ma, Yinji; Xue, Yeguang; Jang, Kyung-In; Feng, Xue; Rogers, John A.; Huang, Yonggang

    2016-08-01

    A stiff thin film bonded to a pre-strained, compliant substrate wrinkles into a sinusoidal form upon release of the pre-strain. Many analytical models developed for the critical pre-strain for wrinkling assume that the substrate is semi-infinite. This critical pre-strain is actually much smaller than that for a substrate with finite thickness (Ma Y et al. 2016 Adv. Funct. Mater. (doi:10.1002/adfm.201600713)). An analytical solution of the critical pre-strain for a system of a stiff film bonded to a pre-strained, finite-thickness, compliant substrate is obtained, and it agrees well with the finite-element analysis. The finite-thickness effect is significant when the substrate tensile stiffness cannot overwhelm the film tensile stiffness.

  2. Determination of thickness uniformity of a transparent film based on in-plane ESPI and radial basis function

    NASA Astrophysics Data System (ADS)

    Dai, Xiangjun; Shao, Xinxing; Yang, Fujun; Yun, Hai

    2016-06-01

    In-plane electronic speckle pattern interferometry (ESPI) was developed to determine the thickness uniformity of a transparent film. The method is based on the subsequent spatial carrier patterns caused by the change of the rotation angle. Full-field thickness distribution can be obtained according to the relation between the phase difference and optical path difference generated by film rotation. Moreover, radial basis function was applied to improve the image quality of interference patterns. The main principle and experimental procedure of the method were presented. The errors of measurement results were analyzed. It is shown that the thickness uniformity of the thin film can be measured rapidly and accurately. Also, the refractive index can be determined by the developed method simultaneously.

  3. Wrinkling of a stiff thin film bonded to a pre-strained, compliant substrate with finite thickness.

    PubMed

    Ma, Yinji; Xue, Yeguang; Jang, Kyung-In; Feng, Xue; Rogers, John A; Huang, Yonggang

    2016-08-01

    A stiff thin film bonded to a pre-strained, compliant substrate wrinkles into a sinusoidal form upon release of the pre-strain. Many analytical models developed for the critical pre-strain for wrinkling assume that the substrate is semi-infinite. This critical pre-strain is actually much smaller than that for a substrate with finite thickness (Ma Y et al. 2016 Adv. Funct. Mater. (doi:10.1002/adfm.201600713)). An analytical solution of the critical pre-strain for a system of a stiff film bonded to a pre-strained, finite-thickness, compliant substrate is obtained, and it agrees well with the finite-element analysis. The finite-thickness effect is significant when the substrate tensile stiffness cannot overwhelm the film tensile stiffness.

  4. Piezoelectric and magnetoelectric thick films for fabricating power sources in wireless sensor nodes.

    PubMed

    Priya, Shashank; Ryu, Jungho; Park, Chee-Sung; Oliver, Josiah; Choi, Jong-Jin; Park, Dong-Soo

    2009-01-01

    In this manuscript, we review the progress made in the synthesis of thick film-based piezoelectric and magnetoelectric structures for harvesting energy from mechanical vibrations and magnetic field. Piezoelectric compositions in the system Pb(Zr,Ti)O(3)-Pb(Zn(1/3)Nb(2/3))O(3) (PZNT) have shown promise for providing enhanced efficiency due to higher energy density and thus form the base of transducers designed for capturing the mechanical energy. Laminate structures of PZNT with magnetostrictive ferrite materials provide large magnitudes of magnetoelectric coupling and are being targeted to capture the stray magnetic field energy. We analyze the models used to predict the performance of the energy harvesters and present a full system description.

  5. Micro-particle manipulation by single beam acoustic tweezers based on hydrothermal PZT thick film

    PubMed Central

    Zhu, Benpeng; Xu, Jiong; Li, Ying; Wang, Tian; Xiong, Ke; Lee, Changyang; Yang, Xiaofei; Shiiba, Michihisa; Takeuchi, Shinichi; Zhou, Qifa; Shung, K. Kirk

    2016-01-01

    Single-beam acoustic tweezers (SBAT), used in laboratory-on-a-chip (LOC) device has promising implications for an individual micro-particle contactless manipulation. In this study, a freestanding hydrothermal PZT thick film with excellent piezoelectric property (d33 = 270pC/N and kt = 0.51) was employed for SBAT applications and a press-focusing technology was introduced. The obtained SBAT, acting at an operational frequency of 50MHz, a low f-number (∼0.9), demonstrated the capability to trap and manipulate a micro-particle sized 10μm in the distilled water. These results suggest that such a device has great potential as a manipulator for a wide range of biomedical and chemical science applications. PMID:27014504

  6. Flexible screen printed thick film thermoelectric generator with reduced material resistivity

    NASA Astrophysics Data System (ADS)

    Cao, Z.; Koukharenko, E.; Torah, R. N.; Tudor, J.; Beeby, S. P.

    2014-11-01

    This work presents a flexible thick-film Bismuth Tellurium/Antimony Tellurium (BiTe/SbTe) thermoelectric generator (TEG) with reduced material resistivity fabricated by screen printing technology. Cold isostatic pressing (CIP) was introduced to lower the resistivity of the printed thermoelectric materials. The Seebeck coefficient (α) and the resistivity (ρ) of printed materials were measured as a function of applied pressure. A prototype TEG with 8 thermocouples was fabricated on flexible polyimide substrate. The dimension of a single printed element was 20 mm × 2 mm × 78.4 pm. The coiled-up prototype produced a voltage of 36.4 mV and a maximum power of 40.3 nW from a temperature gradient of 20 °C.

  7. Design guidelines for advanced LSI microcircuit packaging using thick film multilayer technology

    NASA Technical Reports Server (NTRS)

    Peckinpaugh, C. J.

    1974-01-01

    Ceramic multilayer circuitry results from the sequential build-up of two or more layers of pre-determined conductive interconnections separated by dielectric layers and fired at an elevated temperature to form a solidly fused structure. The resultant ceramic interconnect matrix is used as a base to mount active and passive devices and provide the necessary electrical interconnection to accomplish the desired electrical circuit. Many methods are known for developing multilevel conductor mechanisms such as multilayer printed circuits, welded wire matrices, flexible copper tape conductors, and thin and thick-film ceramic multilayers. Each method can be considered as a specialized field with each possessing its own particular set of benefits and problems. This design guide restricts itself to the art of design, fabrication and assembly of ceramic multilayer circuitry and the reliability of the end product.

  8. Piezoelectric and Magnetoelectric Thick Films for Fabricating Power Sources in Wireless Sensor Nodes

    PubMed Central

    Priya, Shashank; Ryu, Jungho; Park, Chee-Sung; Oliver, Josiah; Choi, Jong-Jin; Park, Dong-Soo

    2009-01-01

    In this manuscript, we review the progress made in the synthesis of thick film-based piezoelectric and magnetoelectric structures for harvesting energy from mechanical vibrations and magnetic field. Piezoelectric compositions in the system Pb(Zr,Ti)O3–Pb(Zn1/3Nb2/3)O3 (PZNT) have shown promise for providing enhanced efficiency due to higher energy density and thus form the base of transducers designed for capturing the mechanical energy. Laminate structures of PZNT with magnetostrictive ferrite materials provide large magnitudes of magnetoelectric coupling and are being targeted to capture the stray magnetic field energy. We analyze the models used to predict the performance of the energy harvesters and present a full system description. PMID:22454590

  9. Influence of surface roughness and waviness on film thickness and pressure distribution in elastohydrodynamic contacts

    NASA Technical Reports Server (NTRS)

    Chow, L. S. H.; Cheng, H. S.

    1976-01-01

    The Christensen theory of a stochastic model for hydrodynamic lubrication of rough surfaces was extended to elastohydrodynamic lubrication between two rollers. Solutions for the reduced pressure at the entrance as a function of the ratio of the average nominal film thickness to the rms surface roughness, were obtained numerically. Results were obtained for purely transverse as well as purely longitudinal surface roughness for cases with or without slip. The reduced pressure was shown to decrease slightly by considering longitudinal surface roughness. The same approach was used to study the effect of surface roughness on lubrication between rigid rollers and lubrication of an infinitely wide slider bearing. Using the flow balance concept, the perturbed Reynolds equation, was derived and solved for the perturbed pressure distribution. In addition, Cheng's numerical scheme was modified to incorporate a single two-dimensional elastic asperity on the stationary surface. The perturbed pressures obtained by these three different models were compared.

  10. Disposable blood potassium sensors based on screen-printed thick film electrodes

    NASA Astrophysics Data System (ADS)

    Xu, Hui; Yang, Xiaoxi; Wang, You; Zheng, Junbao; Luo, Zhiyuan; Li, Guang

    2010-05-01

    A sensor based on the screen-printing technique for the rapid blood potassium test was developed. The sensor consists of a thick film potassium ion-selective electrode and a reference electrode. Poly(3,4-ethylenedioxythiophene) (PEDOT) doped with poly(styrenesulfonate) (PSS) was screen-printed on carbon electrodes as an internal solid contact layer for both ion-selective and reference electrodes. PVC membranes with and without selective ionphore valinomycin were coated on the PEDOT/PSS layer to form potassium ion-selective and reference electrodes, respectively. The potentiometric response characters were evaluated. The response time of the sensor was 15 s when less than 15 µL of sample was applied. The sensitivity of the potassium sensor was around 60 mV per decade, while the potentiometric log selectivity coefficients were -3.43 and -3.48 for Na+ and Ca2+, respectively.

  11. Spin waves in micro-structured yttrium iron garnet nanometer-thick films

    SciTech Connect

    Jungfleisch, Matthias B. Zhang, Wei; Jiang, Wanjun; Wu, Stephen M.; Pearson, John E.; Bhattacharya, Anand; Hoffmann, Axel; Chang, Houchen; Wu, Mingzhong; Sklenar, Joseph; Ketterson, John B.

    2015-05-07

    We investigated the spin-wave propagation in a micro-structured yttrium iron garnet waveguide of 40 nm thickness. Utilizing spatially-resolved Brillouin light scattering microscopy, an exponential decay of the spin-wave amplitude of (10.06 ± 0.83) μm was observed. This leads to an estimated Gilbert damping constant of α=(8.79±0.73)×10{sup −4}, which is larger than damping values obtained through ferromagnetic resonance measurements in unstructured films. The theoretically calculated spatial interference of waveguide modes was compared to the spin-wave pattern observed experimentally by means of Brillouin light scattering spectroscopy.

  12. Study of nanometer-thick graphite film for high-power EUVL pellicle

    NASA Astrophysics Data System (ADS)

    Kim, Mun Ja; Jeon, Hwan Chul; Chalykh, Roman; Kim, Eokbong; Na, Jihoon; Kim, Byung-Gook; Kim, Heebom; Jeon, Chanuk; Kim, Seul-Gi; Shin, Dong-Wook; Kim, Taesung; Kim, Sooyoung; Lee, Jung Hun; Yoo, Ji-Beom

    2016-03-01

    Extreme ultraviolet (EUV) lithography has received much attention in the semiconductor industry as a promising candidate to extend dimensional scaling beyond 10nm. Recently EUV pellicle introduction is required to improve particle level inside scanner for EUV mass production. We demonstrate that a new pellicle material, nanometer-thick graphite film (NGF), is one of the best candidates of EUV pellicle membrane. A NGF pellicle with excellent thermal (ɛ≥0.4 @R.T, <100nm), mechanical (415MPa @~100nm), chemical and optical (24hrs durability under exposure of EUV/H2 at 4W/cm2 with pH2~5Pa) properties can be a promising and superb candidate for EUV pellicle membrane compared to Si pellicles with capping layers.

  13. Diametral tensile strength and film thickness of an experimental dental luting agent derived from castor oil

    PubMed Central

    CARMELLO, Juliana Cabrini; FAIS, Laiza Maria Grassi; RIBEIRO, Lígia Nunes de Moraes; CLARO NETO, Salvador; GUAGLIANONI, Dalton Geraldo; PINELLI, Lígia Antunes Pereira

    2012-01-01

    The need to develop new dental luting agents in order to improve the success of treatments has greatly motivated research. Objective The aim of this study was to evaluate the diametral tensile strength (DTS) and film thickness (FT) of an experimental dental luting agent derived from castor oil (COP) with or without addition of different quantities of filler (calcium carbonate - CaCO3). Material and Methods Eighty specimens were manufactured (DTS N=40; FT N=40) and divided into 4 groups: Pure COP; COP 10%; COP 50% and zinc phosphate (control). The cements were mixed according to the manufacturers' recommendations and submitted to the tests. The DTS test was performed in the MTS 810 testing machine (10 KN, 0.5 mm/min). For FT test, the cements were sandwiched between two glass plates (2 cm2) and a load of 15 kg was applied vertically on the top of the specimen for 10 min. The data were analyzed by means of one-way ANOVA and Tukey's test (α=0.05). Results The values of DTS (MPa) were: Pure COP- 10.94±1.30; COP 10%- 30.06±0.64; COP 50%- 29.87±0.27; zinc phosphate- 4.88±0.96. The values of FT (µm) were: Pure COP- 31.09±3.16; COP 10%- 17.05±4.83; COP 50%- 13.03±4.83; Zinc Phosphate- 20.00±0.12. One-way ANOVA showed statistically significant differences among the groups (DTS - p=1.01E-40; FT - p=2.4E-10). Conclusion The experimental dental luting agent with 50% of filler showed the best diametral tensile strength and film thickness. PMID:22437672

  14. Properties of PZT thick film made on LTCC substrates with dielectric intermediate layers

    NASA Astrophysics Data System (ADS)

    DÄ browski, Arkadiusz; Golonka, Leszek

    2016-11-01

    Results of experiments on application of various interlayers between LTCC (Low Temperature Cofired Ceramics) substrate and thick-film PZT (Lead Zirconate - Titanate) are described in this work. Thick-film intermediate layers were based on several dielectric materials: TiN, Al2O3, SiC, TiO2, SiC, YSZ, BN. Seven screen printable pastes were prepared on the base of powders of mentioned materials with addition of glass and organic vehicle. The substrates were made of 951 (DuPont), CeramTapeGC (CeramTec) and HL2000 (Heraeus) LTCC tapes. Sandwich type transducers, consisting of barrier layer, gold bottom electrode, PZT layer and silver top electrode were prepared and characterized. Basic piezoelectric parameters - permittivity, effective charge constant (d33(eff)) and remanent polarization were determined. The best properties were obtained for substrates made of 951. In general, interlayers based on TiO2, SiC and Al2O3 improved permittivity and charge constant comparing to bare substrates. For example, for 951 substrate the PZT layer exhibited d33(eff) equal to 160, 215, 250 and 230 pC/N for bare substrate, TiO2 interlayer, SiC interlayer and Al2O3 interlayer, respectively. In case of CeramTape GC substrates determined permittivity was equal to 215, 245, 235 and 275 for bare substrate, TiO2 interlayer, SiC interlayer and Al2O3 interlayer, respectively. In case of TiN and BN materials the parameters were considerably deteriorated.

  15. An Ion-selective Electrode for Anion Perchlorate in Thick-film Technology

    PubMed Central

    Segui, María Jesús; Lizondo-Sabater, Josefa; Martínez-Máñez, Ramon; Sancenon, Félix; Soto, Juan; Garcia-Breijo, Eduardo; Gil, Luis

    2006-01-01

    The ionophore 1,4,7,10,13-penta(n-octyl)-1,4,7,10,13-pentaazacyclopentadecane (L1) was used for the development of miniaturised perchlorate-selective electrodes in thick-film technology. Different PVC membranes containing L1 and the plasticizers o-nitrophenyl octyl ether (NPOE), dibutyl phthalate (DBP), bis(2-ethylhexyl)sebacate (DOS) and dibutyl sebacate (DBS) were prepared and placed on a graphite working electrode manufactured by using thick film serigraphic technology. The perchlorate selective electrode containing DBS as plasticizer showed a potentiometric Nernstian response of -57 mV per decade in a range of perchlorate concentration from 1 × 10-4 to 1 × 10-1 M with a detection limit of 5 × 10-5 M. The ion selective electrodes containing DBP and NPOE as plasticizers exhibit a working range from 6.3 × 10-5 to 1 × 10-1 M and 7.4 × 10-5 to 1 × 10-1 M for perchlorate, respectively, with a detection limit of ca. 2.2 × 10-5 M. For all three electrodes a response time of ca. 5 s was found. The prepared electrodes do not show appreciable decay of the slope for at least 25 days. Potentiometric selectivity coefficients (log KpotClO4-,X-) with respect to the primary anion perchlorate were evaluated using the fixed interference method. These coefficients are of the order of 10-1.7 or smaller, indicating the relatively poor interference of the different anions studied.

  16. Real-Space Direct Visualization of the Layer-Dependent Roughening Transition in Nanometer-Thick Pb Films

    NASA Astrophysics Data System (ADS)

    Calleja, F.; Passeggi, M. C. G., Jr.; Hinarejos, J. J.; de Parga, A. L. Vázquez; Miranda, R.

    2006-11-01

    By means of variable-temperature scanning tunneling microscopy and spectroscopy we studied the thickness-dependent roughening temperature of Pb films grown on Cu(111), whose electronic structure and total energy is controlled by quantum well states created by the spatial confinement of electrons. Large scale STM images are employed to quantify the layer population, i.e., the fraction of the surface area covered by different Pb thicknesses, directly in the real space as a function of temperature. The roughening temperature oscillates repeatedly with bilayer periodicity plus a longer beating period, mirroring the thickness dependence of surface energy calculations. Conditions have been found to stabilize at 300 K Pb films of particular magic thicknesses, atomically flat over microns.

  17. In vivo sweat film layer thickness measured with Fourier-domain optical coherence tomography (FD-OCT)

    NASA Astrophysics Data System (ADS)

    Jonathan, Enock

    2008-06-01

    While human sweat secretion is accepted as a mechanism by which the body cools off, excessive sweating (hyperhidrosis) is now appreciated as a medical condition and the primary site for diagnosis is the palm of the hand. We propose sweat film layer thickness as a potential clinical diagnostic parameter when screening for excessive sweating. In this preliminary study we demonstrate the usefulness of Fourier-domain optical coherence tomography (FD-OCT) for measurement of sweat film thickness in vivo with micron-scale resolution on the hand of a human volunteer. FD-OCT has a superior image acquisition time and identification of active sweat glands, ducts and pores is also possible.

  18. Transparent and through thickness conductive polystyrene films using external magnetic fields for ``Z'' alignment of nickel nanoparticles

    NASA Astrophysics Data System (ADS)

    Chen, Yuwei; Guo, Yuanhao; Batra, Saurabh; Wang, Enmin; Wang, Yanping; Liu, Xueqing; Wang, Yimin; Cakmak, Miko

    2015-08-01

    A combination of transparency, electrical conductivity and flexibility is desired in the emerging flexible electronics industry for current and future applications. In this paper, we report the development of through thickness electrical conductivity in polystyrene films filled with nickel nanopowder by external magnetic field application. This process leads to the formation of nanocolumns of nickel spanning across the thickness direction while generating nanoparticle depleted regions in between. This leads to directionally dependent enhancement in optical light transmission particularly in the normal direction of the films. With the use of as little as 2 wt% (0.22 vol%) nickel we were able to achieve high through thickness conductivity under the influence of a magnetic field. While these films exhibit high through thickness conductivity they remain non-conductive in their planes as a result of the unique nanomorphology created which eliminates potential side branch formations. These films are anticipated to be used as electrodes for touch screens, electric dissipative materials for electronic packaging and other sensors.A combination of transparency, electrical conductivity and flexibility is desired in the emerging flexible electronics industry for current and future applications. In this paper, we report the development of through thickness electrical conductivity in polystyrene films filled with nickel nanopowder by external magnetic field application. This process leads to the formation of nanocolumns of nickel spanning across the thickness direction while generating nanoparticle depleted regions in between. This leads to directionally dependent enhancement in optical light transmission particularly in the normal direction of the films. With the use of as little as 2 wt% (0.22 vol%) nickel we were able to achieve high through thickness conductivity under the influence of a magnetic field. While these films exhibit high through thickness conductivity they

  19. Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain

    NASA Astrophysics Data System (ADS)

    Yoo, Hyang Keun; Hyun, Seung Ill; Chang, Young Jun; Moreschini, Luca; Sohn, Chang Hee; Kim, Hyeong-Do; Bostwick, Aaron; Rotenberg, Eli; Shim, Ji Hoon; Noh, Tae Won

    2016-01-01

    We investigated electronic-structure changes of tensile-strained ultrathin LaNi O3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness tc between four and three UCs below which Ni eg electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below tc consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES.

  20. Structural study and wetting behavior of ethane and tetrafluoromethane thick films adsorbed on graphite (0001)

    NASA Astrophysics Data System (ADS)

    Gay, Jean-Marc; Suzanne, Jean; Pepe, Gérard; Meichel, Thierry

    1988-10-01

    We present a quantitative study of the diffraction patterns (LEED, RHEED and neutron) of ethane and tetrafluoromethane thick films adsorbed on graphite (0001). We propose to interpret the streak-like RHEED patterns of C 2H 6 and CF 4 with tabular crystallites epitaxially grown on the thin underlying film. The growth of flat ethane crystallites is explained by a partial agreement of the lattice parameters, the symmetry and the molecule orientations between the bilayer structure deduced from static energy calculations and the structure within the 3D (011) plane which appears as the interfacial plane. The change in the CF 4 RHEED pattern observed at T = 37 K and previously considered as the signature of a wetting transition might be due to a change of interfacial plane. It could be the 3D (100) or (001) plane in which a hexagonal or quasi-hexagonal symmetry in the molecule packing appears for T > 37 K. At lower temperature, T < 37 K, this symmetry could be lost with the (101¯) interfacial plane which presents a quasi-square molecule packing. We would like to emphasize the caution necessary for interpreting RHEED results. The determination of the growth mode requires the combination of different methods of measurements in order to draw conclusions without ambiguities. These two molecular systems show rather well the difficulties for interpreting experimental results on the wetting phenomenon.

  1. Thickness-Dependent Properties of YBCO Films Grown on GZO/CLO-Buffered NiW Substrates

    NASA Astrophysics Data System (ADS)

    Malmivirta, M.; Huhtinen, H.; Zhao, Y.; Grivel, J.-C.; Paturi, P.

    2017-01-01

    To study the role of novel Gd_2Zr_2O_7/Ce_{0.9}La_{0.1}O_2 buffer layer structure on a biaxially textured NiW substrate, a set of YBa_2Cu_3O_{7-δ } (YBCO) films with different thicknesses were prepared by pulsed laser deposition (PLD). Interface imperfections as well as thickness-dependent structural properties were observed in the YBCO thin films. The structure is also reflected into the improved superconducting properties with the highest critical current densities in films with intermediate thicknesses. Therefore, it can be concluded that the existing buffer layers need more optimization before they can be successfully used for films with various thicknesses. This issue is linked to the extremely susceptible growth method of PLD when compared to the commonly used chemical deposition methods. Nevertheless, PLD-grown films can give a hint on what to concentrate to be able to further improve the buffer layer structures for future coated conductor technologies.

  2. a Unified Theory of Measurement of Anisotropic Resistivity Based on a Single Surface of One (from Thin to Thick) Film

    NASA Astrophysics Data System (ADS)

    He, Yuan; Xiang, Xiang; Dai, Xianxi; Evenson, William E.

    2012-11-01

    A unified method and theory for measuring anisotropic resistivity based on a single surface of a film with rapidly converging exact solutions is presented here for solutions appropriate to thin films (Type I solutions) and to thick samples (Type II solutions). Some of the exact solutions of the related simultaneous equation systems can be expressed in terms of elementary functions. The theory proposed here for measuring resistivity of anisotropic crystals is expected to be useful in many applications.

  3. Thickness dependent activity of nanostructured TiO 2/α-Fe 2O 3 photocatalyst thin films

    NASA Astrophysics Data System (ADS)

    Akhavan, O.

    2010-12-01

    The effect of thickness of TiO 2 coating on synergistic photocatalytic activity of TiO 2 (anatase)/α-Fe 2O 3/glass thin films as photocatalysts for degradation of Escherichia coli bacteria in a low-concentration H 2O 2 solution and under visible light irradiation was investigated. Nanograined α-Fe 2O 3 films with optical band-gap of 2.06 eV were fabricated by post-annealing of thermal evaporated iron oxide thin films at 400 °C in air. Increase in thickness of the Fe 2O 3 thin film (here, up to 200 nm) resulted in a slight reduction of the optical band-gap energy and an increase in the photoinactivation of the bacteria. Sol-gel TiO 2 coatings were deposited on the α-Fe 2O 3 (200 nm)/glass films, and then, they were annealed at 400 °C in air for crystallization of the TiO 2 and formation of TiO 2/Fe 2O 3 heterojunction. For the TiO 2 coatings with thicknesses ≤50 nm, the antibacterial activity of the TiO 2/α-Fe 2O 3 (200 nm) was found to be better than the activity of the bare α-Fe 2O 3 film. The optimum thickness of the TiO 2 coating was found to be 10 nm, resulting in about 70 and 250% improvement in visible light photo-induced antibacterial activity of the TiO 2/α-Fe 2O 3 thin film as compared to the corresponding activity of the bare α-Fe 2O 3 and TiO 2 thin films, respectively. The improvement in the photoinactivation of bacteria on surface of TiO 2/α-Fe 2O 3 was assigned to formation of Ti-O-Fe bond at the interface.

  4. Thickness dependent quantum oscillations of transport properties in topological insulator Bi2Te3 thin films

    NASA Astrophysics Data System (ADS)

    Rogacheva, E. I.; Budnik, A. V.; Sipatov, A. Yu.; Nashchekina, O. N.; Dresselhaus, M. S.

    2015-02-01

    The dependences of the electrical conductivity, the Hall coefficient, and the Seebeck coefficient on the layer thickness d (d = 18-600 nm) of p-type topological insulator Bi2Te3 thin films grown by thermal evaporation in vacuum on glass substrates were obtained at room temperature. In the thickness range of d = 18-100 nm, sustained oscillations with a substantial amplitude were revealed. The observed oscillations are well approximated by a harmonic function with a period Δd = (9.5 ± 0.5) nm. At d > 100 nm, the transport coefficients practically do not change as d is increased. The oscillations of the kinetic properties are attributed to the quantum size effects due to the hole confinement in the Bi2Te3 quantum wells. The results of the theoretical calculations of Δd within the framework of a model of an infinitely deep potential well are in good agreement with the experimental results. It is suggested that the substantial amplitude of the oscillations and their sustained character as a function of d are connected with the topologically protected gapless surface states of Bi2Te3 and are inherent to topological insulators.

  5. The impact of the layer thickness on the thermodynamic properties of pd hydride thin film electrodes.

    PubMed

    Vermeulen, Paul; Ledovskikh, Alexander; Danilov, Dmitry; Notten, Peter H L

    2006-10-19

    Recently, a lattice gas model was presented and successfully applied to simulate the absorption/desorption isotherms of various hydride-forming materials. The simulation results are expressed by parameters corresponding to several energy contributions, e.g., interaction energies. However, the use of a model system is indispensable in order to show the strength of the simulations. The palladium-hydrogen system is one of the most thoroughly described metal hydrides found in the literature and is therefore ideal for this purpose. The effects of decreasing the thickness of Pd thin films on the isotherms have been monitored experimentally and subsequently simulated. An excellent fit of the lattice gas model to the experimental data is found, and the corresponding parameters are used to describe several thermodynamic properties. It is analyzed that the contribution of H-H interaction energies to the total energy and the influence of the host lattice energy are significantly and systematically changing as a function of Pd thickness. Conclusively, it has been verified that the lattice gas model is a useful tool to analyze thermodynamic properties of hydrogen storage materials.

  6. Ferroelectric polymer-ceramic composite thick films for energy storage applications

    SciTech Connect

    Singh, Paritosh; Borkar, Hitesh; Singh, B. P.; Singh, V. N.; Kumar, Ashok

    2014-08-15

    We have successfully fabricated large area free standing polyvinylidene fluoride -Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} (PVDF-PZT) ferroelectric polymer-ceramic composite (wt% 80–20, respectively) thick films with an average diameter (d) ∼0.1 meter and thickness (t) ∼50 μm. Inclusion of PZT in PVDF matrix significantly enhanced dielectric constant (from 10 to 25 at 5 kHz) and energy storage capacity (from 11 to 14 J/cm{sup 3}, using polarization loops), respectively, and almost similar leakage current and mechanical strength. Microstructural analysis revealed the presence of α and β crystalline phases and homogeneous distribution of PZT crystals in PVDF matrix. It was also found that apart from the microcrystals, well defined naturally developed PZT nanocrystals were embedded in PVDF matrix. The observed energy density indicates immense potential in PVDF-PZT composites for possible applications as green energy and power density electronic elements.

  7. The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.

    PubMed

    Wang, Zi-Yi; Zhang, Rong-Jun; Lu, Hong-Liang; Chen, Xin; Sun, Yan; Zhang, Yun; Wei, Yan-Feng; Xu, Ji-Ping; Wang, Song-You; Zheng, Yu-Xiang; Chen, Liang-Yao

    2015-01-01

    The aluminum oxide (Al2O3) thin films with various thicknesses under 50 nm were deposited by atomic layer deposition (ALD) on silicon substrate. The surface topography investigated by atomic force microscopy (AFM) revealed that the samples were smooth and crack-free. The ellipsometric spectra of Al2O3 thin films were measured and analyzed before and after annealing in nitrogen condition in the wavelength range from 250 to 1,000 nm, respectively. The refractive index of Al2O3 thin films was described by Cauchy model and the ellipsometric spectra data were fitted to a five-medium model consisting of Si substrate/SiO2 layer/Al2O3 layer/surface roughness/air ambient structure. It is found that the refractive index of Al2O3 thin films decrease with increasing film thickness and the changing trend revised after annealing. The phenomenon is believed to arise from the mechanical stress in ALD-Al2O3 thin films. A thickness transition is also found by transmission electron microscopy (TEM) and SE after 900°C annealing.

  8. Thickness-dependent coherent phonon frequency in ultrathin FeSe/SrTiO3 films

    SciTech Connect

    Yang, Shuolong; Sobota, Jonathan A.; Leuenberger, Dominik; Kemper, Alexander F.; Lee, James J.; Schmitt, Felix T.; Li, Wei; Moore, Rob G.; Kirchmann, Patrick S.; Shen, Zhi -Xun

    2015-06-01

    Ultrathin FeSe films grown on SrTiO3 substrates are a recent milestone in atomic material engineering due to their important role in understanding unconventional superconductivity in Fe-based materials. By using femtosecond time- and angle-resolved photoelectron spectroscopy, we study phonon frequencies in ultrathin FeSe/SrTiO3 films grown by molecular beam epitaxy. After optical excitation, we observe periodic modulations of the photoelectron spectrum as a function of pump–probe delay for 1-unit-cell, 3-unit-cell, and 60-unit-cell thick FeSe films. The frequencies of the coherent intensity oscillations increase from 5.00 ± 0.02 to 5.25 ± 0.02 THz with increasing film thickness. By comparing with previous works, we attribute this mode to the Se A1g phonon. The dominant mechanism for the phonon softening in 1-unit-cell thick FeSe films is a substrate-induced lattice strain. Results demonstrate an abrupt phonon renormalization due to a lattice mismatch between the ultrathin film and the substrate.

  9. Thickness Dependent Nanostructural, Morphological, Optical and Impedometric Analyses of Zinc Oxide-Gold Hybrids: Nanoparticle to Thin Film

    PubMed Central

    Perumal, Veeradasan; Hashim, Uda; Gopinath, Subash C. B.; Haarindraprasad, R.; Liu, Wei-Wen; Poopalan, P.; Balakrishnan, S. R.; Thivina, V.; Ruslinda, A. R.

    2015-01-01

    The creation of an appropriate thin film is important for the development of novel sensing surfaces, which will ultimately enhance the properties and output of high-performance sensors. In this study, we have fabricated and characterized zinc oxide (ZnO) thin films on silicon substrates, which were hybridized with gold nanoparticles (AuNPs) to obtain ZnO-Aux (x = 10, 20, 30, 40 and 50 nm) hybrid structures with different thicknesses. Nanoscale imaging by field emission scanning electron microscopy revealed increasing film uniformity and coverage with the Au deposition thickness. Transmission electron microscopy analysis indicated that the AuNPs exhibit an increasing average diameter (5–10 nm). The face center cubic Au were found to co-exist with wurtzite ZnO nanostructure. Atomic force microscopy observations revealed that as the Au content increased, the overall crystallite size increased, which was supported by X-ray diffraction measurements. The structural characterizations indicated that the Au on the ZnO crystal lattice exists without any impurities in a preferred orientation (002). When the ZnO thickness increased from 10 to 40 nm, transmittance and an optical bandgap value decreased. Interestingly, with 50 nm thickness, the band gap value was increased, which might be due to the Burstein-Moss effect. Photoluminescence studies revealed that the overall structural defect (green emission) improved significantly as the Au deposition increased. The impedance measurements shows a decreasing value of impedance arc with increasing Au thicknesses (0 to 40 nm). In contrast, the 50 nm AuNP impedance arc shows an increased value compared to lower sputtering thicknesses, which indicated the presence of larger sized AuNPs that form a continuous film, and its ohmic characteristics changed to rectifying characteristics. This improved hybrid thin film (ZnO/Au) is suitable for a wide range of sensing applications. PMID:26694656

  10. Monolithic Pellets, Composites and Thick Films of Hydroxyapatite: Correlation of Mechanical Properties with Microstructure.

    NASA Astrophysics Data System (ADS)

    Wang, Pauchiu Either

    Hydroxyapatite Ca_{10}(PO _4)_6(OH)_2 (abbreviated as HA) has great biocompatibility. Poor mechanical properties of HA implants and decomposition of HA during processing are the major obstacles for widespread uses of HA. In the present thesis we have attempted to understand the sintering behavior of monolithic HA and metal-reinforced HA-matrix composites, and the mechanism of formation of HA coating in the solutions at the normal temperature. The powders of two calcium phosphates, namely hydroxyapatite and dicalcium phosphate (DCP: chemical formula Ca_2P_2O_7), were sintered at various temperatures and in various environments. The density, flexural strength and knoop hardness of both phosphates sintered in air for 4 h initially increased with the sintering temperature, reaching maxima at around 1000-1150 ^circC, and then decreased due to decomposition. To reduce dehydroxylation, HA powder was sintered in moisture at various temperatures up to 1350^circ C and X-ray diffraction study did not indicate any decomposition at the highest sintering temperature. It is seen that dehydroxylation did not hinder sintering, but decomposition obstructed sintering of both HA and DCP. Ductile-phase reinforcement of hydroxyapatite was achieved by addition of silver particulates (5-30 vol.%) in HA powder compacts. A composite made by sintering 10 vol.% Ag and balance HA at 1200^circ C for 1 h in air had flexural strength of 75 +/- 7 MPa, which was almost double that of pure HA sintered under an identical condition. Silver in the composite melted during sintering, but due to poor wetting, did not spread in between HA particles. The increase in the flexural strength of the composites was thought to be due to crack-bridging and crack-arrest by silver inclusions. Thick films (several μm) of hydroxyapatite were deposited on silicon single crystal placed in close proximity to a plate of apatite- and wollastonite -containing glass and dipped into a simulated body fluid (SBF) at 36^circ

  11. Temperature and layer thickness dependent in situ investigations on epindolidione organic thin-film transistors.

    PubMed

    Lassnig, R; Striedinger, B; Jones, A O F; Scherwitzl, B; Fian, A; Głowacl, E D; Stadlober, B; Winkler, A

    2016-08-01

    We report on in situ performance evaluations as a function of layer thickness and substrate temperature for bottom-gate, bottom-gold contact epindolidione organic thin-film transistors on various gate dielectrics. Experiments were carried out under ultra-high vacuum conditions, enabling quasi-simultaneous electrical and surface analysis. Auger electron spectroscopy and thermal desorption spectroscopy (TDS) were applied to characterize the quality of the substrate surface and the thermal stability of the organic films. Ex situ atomic force microscopy (AFM) was used to gain additional information on the layer formation and surface morphology of the hydrogen-bonded organic pigment. The examined gate dielectrics included SiO2, in its untreated and sputtered forms, as well as the spin-coated organic capping layers poly(vinyl-cinnamate) (PVCi) and poly((±)endo,exo-bicyclo[2.2.1]hept-5-ene-2,3-dicarboxylic acid, diphenylester) (PNDPE, from the class of polynorbornenes). TDS and AFM revealed Volmer-Weber island growth dominated film formation with no evidence of a subjacent wetting layer. This growth mode is responsible for the comparably high coverage required for transistor behavior at 90-95% of a monolayer composed of standing molecules. Surface sputtering and an increased sample temperature during epindolidione deposition augmented the surface diffusion of adsorbing molecules and therefore led to a lower number of better-ordered islands. Consequently, while the onset of charge transport was delayed, higher saturation mobility was obtained. The highest, bottom-contact configuration, mobilities of approximately 2.5 × 10(-3)cm(2)/Vs were found for high coverages (50 nm) on sputtered samples. The coverage dependence of the mobility showed very different characteristics for the different gate dielectrics, while the change of the threshold voltage with coverage was approximately the same for all systems. An apparent decrease of the mobility with increasing coverage on the

  12. Temperature and layer thickness dependent in situ investigations on epindolidione organic thin-film transistors

    PubMed Central

    Lassnig, R.; Striedinger, B.; Jones, A.O.F.; Scherwitzl, B.; Fian, A.; Głowacl, E.D.; Stadlober, B.; Winkler, A.

    2016-01-01

    We report on in situ performance evaluations as a function of layer thickness and substrate temperature for bottom-gate, bottom-gold contact epindolidione organic thin-film transistors on various gate dielectrics. Experiments were carried out under ultra-high vacuum conditions, enabling quasi-simultaneous electrical and surface analysis. Auger electron spectroscopy and thermal desorption spectroscopy (TDS) were applied to characterize the quality of the substrate surface and the thermal stability of the organic films. Ex situ atomic force microscopy (AFM) was used to gain additional information on the layer formation and surface morphology of the hydrogen-bonded organic pigment. The examined gate dielectrics included SiO2, in its untreated and sputtered forms, as well as the spin-coated organic capping layers poly(vinyl-cinnamate) (PVCi) and poly((±)endo,exo-bicyclo[2.2.1]hept-5-ene-2,3-dicarboxylic acid, diphenylester) (PNDPE, from the class of polynorbornenes). TDS and AFM revealed Volmer-Weber island growth dominated film formation with no evidence of a subjacent wetting layer. This growth mode is responsible for the comparably high coverage required for transistor behavior at 90–95% of a monolayer composed of standing molecules. Surface sputtering and an increased sample temperature during epindolidione deposition augmented the surface diffusion of adsorbing molecules and therefore led to a lower number of better-ordered islands. Consequently, while the onset of charge transport was delayed, higher saturation mobility was obtained. The highest, bottom-contact configuration, mobilities of approximately 2.5 × 10−3cm2/Vs were found for high coverages (50 nm) on sputtered samples. The coverage dependence of the mobility showed very different characteristics for the different gate dielectrics, while the change of the threshold voltage with coverage was approximately the same for all systems. An apparent decrease of the mobility with increasing coverage on the

  13. Electrochemically exfoliated graphene for electrode films: effect of graphene flake thickness on the sheet resistance and capacitive properties.

    PubMed

    Liu, Jinzhang; Notarianni, Marco; Will, Geoffrey; Tiong, Vincent Tiing; Wang, Hongxia; Motta, Nunzio

    2013-10-29

    We present an electrochemical exfoliation method to produce controlled thickness graphene flakes by ultrasound assistance. Bilayer graphene flakes are dominant in the final product by using sonication during the electrochemical exfoliation process, while without sonication the product contains a larger percentage of four-layer graphene flakes. Graphene sheets prepared by using the two procedures are processed into films to measure their respective sheet resistance and optical transmittance. Solid-state electrolyte supercapacitors are made using the two types of graphene films. Our study reveals that films with a higher content of multilayer graphene flakes are more conductive, and their resistance is more easily reduced by thermal annealing, making them suitable as transparent conducting films. The film with higher content of bilayer graphene flakes shows instead higher capacitance when used as electrode in a supercapacitor.

  14. Structural and optical properties of thick freestanding AlN films prepared by hydride vapor phase epitaxy

    NASA Astrophysics Data System (ADS)

    Freitas, J. A.; Culbertson, J. C.; Mastro, M. A.; Kumagai, Y.; Koukitu, A.

    2012-07-01

    The morphology, structural and optical properties of void-assisted freestanding HVPE-AlN films were investigated by a combination of non-destructive microscopic and spectroscopic techniques. The freestanding approximately 80 μm thick clear film has a wurtzite crystalline structure with remarkable properties around the central film region. The E2(high)-phonon frequency coincides with reported stress-free film phonon frequency. The low temperature luminescence study of the growth and interface sides of the film is consistent with the incorporation of a high concentration of oxygen impurities. These results are promising as the growth method amenable to the production of freestanding stress-free large area substrates for epitaxial growth.

  15. Structure and Electrical Properties of Na0.5Bi0.5TiO3 Ferroelectric Thick Films Derived From a Polymer Modified Sol-Gel Method

    PubMed Central

    Ji, Hongfen; Ren, Wei; Wang, Lingyan; Shi, Peng; Chen, Xiaofeng; Wu, Xiaoqing; Yao, Xi; Lau, Sien-Ting; Zhou, Qifa; Shung, K. Kirk

    2011-01-01

    Lead-free Na0.5Bi0.5TiO3 (NBT) ferroelectric thick films were prepared by a poly(vinylpyrrolidone) (PVP) modified sol-gel method. The NBT thick films annealed from 500°C to 750°C exhibit a perovskite structure. The relationship between annealing temperature, thickness, and electrical properties of the thick films has been investigated. The dielectric constants and remnant polarizations of the thick films increase with annealing temperature. The electrical properties of the NBT films show strong thickness dependence. As thickness increases from 1.0 to 4.8 μm, the dielectric constant of the NBT films increases from 620 to 848, whereas the dielectric loss is nearly independent of the thickness. The remnant polarization of the NBT thick films also increases with increasing thickness. The leakage current density first decreases and then increases with film thickness. PMID:21989868

  16. Effect of thickness on surface morphology, optical and humidity sensing properties of RF magnetron sputtered CCTO thin films

    NASA Astrophysics Data System (ADS)

    Ahmadipour, Mohsen; Ain, Mohd Fadzil; Ahmad, Zainal Arifin

    2016-11-01

    In this study, calcium copper titanate (CCTO) thin films were deposited on ITO substrates successfully by radio frequency (RF) magnetron sputtering method in argon atmosphere. The CCTO thin films present a polycrystalline, uniform and porous structure. The surface morphology, optical and humidity sensing properties of the synthesized CCTO thin films have been studied by X-ray diffraction (XRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectroscopy (EDX), UV-vis spectrophotometer and current-voltage (I-V) analysis. XRD and AFM confirmed that the intensity of peaks and pore size of CCTO thin films were enhanced by increasing the thin films. Tauc plot method was adopted to estimate the optical band gaps. The surface structure and energy band gaps of the deposited films were affected by film thickness. Energy band gap of the layers were 3.76 eV, 3.68 eV and 3.5 eV for 200 nm, 400 nm, and 600 nm CCTO thin films layer, respectively. The humidity sensing properties were measured by using direct current (DC) analysis method. The response times were 12 s, 22 s, and 35 s while the recovery times were 500 s, 600 s, and 650 s for 200 nm, 400 nm, and 600 nm CCTO thin films, respectively at humidity range of 30-90% relative humidity (RH).

  17. Thickness-dependent electron mobility of single and few-layer MoS2 thin-film transistors

    NASA Astrophysics Data System (ADS)

    Kim, Ji Heon; Kim, Tae Ho; Lee, Hyunjea; Park, Young Ran; Choi, Woong; Lee, Cheol Jin

    2016-06-01

    We investigated the dependence of electron mobility on the thickness of MoS2 nanosheets by fabricating bottom-gate single and few-layer MoS2 thin-film transistors with SiO2 gate dielectrics and Au electrodes. All the fabricated MoS2 transistors showed on/off-current ratio of ˜107 and saturated output characteristics without high-k capping layers. As the MoS2 thickness increased from 1 to 6 layers, the field-effect mobility of the fabricated MoS2 transistors increased from ˜10 to ˜18 cm2V-1s-1. The increased subthreshold swing of the fabricated transistors with MoS2 thickness suggests that the increase of MoS2 mobility with thickness may be related to the dependence of the contact resistance and the dielectric constant of MoS2 layer on its thickness.

  18. Calculation of the sun protection factor of sunscreens with different vehicles using measured film thickness distribution - Comparison with the SPF in vitro.

    PubMed

    Sohn, Myriam; Herzog, Bernd; Osterwalder, Uli; Imanidis, Georgios

    2016-06-01

    The sun protection factor (SPF) depends on UV filter composition, and amount and type of vehicle of the applied sunscreen. In an earlier work, we showed that the vehicle affected the average thickness of sunscreen film that is formed upon application to a skin substrate and that film thickness correlated significantly with SPF in vitro. In the present study, we quantitatively assess the role for sunscreen efficacy of the complete film thickness frequency distribution of sunscreen measured with an oil-in-water cream, an oil-in-water spray, a gel, a water-in-oil, and an alcoholic spray formulation. A computational method is employed to determine SPF in silico from calculated UV transmittance based on experimental film thickness and thickness distribution, and concentration and spectral properties of the UV filters. The investigated formulations exhibited different SPFs in vitro and different film thickness distributions especially in the small thickness range. We found a very good agreement between SPF in silico and SPF in vitro for all sunscreens. This result establishes the relationship between sun protection and the film thickness distribution actually formed by the applied sunscreen and demonstrates that variation in SPF between formulations is primarily due to their film forming properties. It also opens the possibility to integrate the influence of vehicle into tools for in silico prediction of the performance of sunscreen formulations. For this, the use of the Gamma distribution was found to be appropriate for describing film thickness distribution.

  19. Elastohydrodynamic film thickness measurements with advanced ester, fluorocarbon, and polyphenyl ether lubricants to 589 K (600 F)

    NASA Technical Reports Server (NTRS)

    Parker, R. J.; Kannel, J. W.

    1971-01-01

    Elastohydrodynamic (EHD) film thicknesses have been measured, by means of an X-ray technique, under conditions that closely simulate the ball-race contact in advanced turbine engine thrust bearings. The experiments were conducted with a rolling-disk machine using disks which yield a contact zone similar to that in the actual bearing. Both the rolling and spinning motions of the ball relative to the race were simulated by the apparatus. Four lubricants were evaluated at temperatures to 600 F and maximum Hertz stresses to 350,000 psi. The X-ray film thickness data correlated well with observations of surface distress (or lack thereof) in full-scale bearing tests with the same lubricants under similar conditions of temperature and load. The predicted variation of film thickness with speed and viscosity as verified, although the magnitude of measured film thickness was generally one-half to one-third of predicted values. An effect of stress greater than predicted was consistently observed in the higher stress range.

  20. Transparent and through thickness conductive polystyrene films using external magnetic fields for "Z" alignment of nickel nanoparticles.

    PubMed

    Chen, Yuwei; Guo, Yuanhao; Batra, Saurabh; Wang, Enmin; Wang, Yanping; Liu, Xueqing; Wang, Yimin; Cakmak, Miko

    2015-09-21

    A combination of transparency, electrical conductivity and flexibility is desired in the emerging flexible electronics industry for current and future applications. In this paper, we report the development of through thickness electrical conductivity in polystyrene films filled with nickel nanopowder by external magnetic field application. This process leads to the formation of nanocolumns of nickel spanning across the thickness direction while generating nanoparticle depleted regions in between. This leads to directionally dependent enhancement in optical light transmission particularly in the normal direction of the films. With the use of as little as 2 wt% (0.22 vol%) nickel we were able to achieve high through thickness conductivity under the influence of a magnetic field. While these films exhibit high through thickness conductivity they remain non-conductive in their planes as a result of the unique nanomorphology created which eliminates potential side branch formations. These films are anticipated to be used as electrodes for touch screens, electric dissipative materials for electronic packaging and other sensors.

  1. Elastohydrodynamic study of blends of bio-based esters with polyalphaolefin in the low film thickness regime

    Technology Transfer Automated Retrieval System (TEKTRAN)

    The film thickness in elastohydrodynamic conditions for soybean oil (SBO), oleic estolide ester (Est) and their binary blends with polyalphaolefins (PAO2 or PAO40) were studied at 30 and 100°C. Changes with time, for up to 200 min, were monitored. SBO and its blends with the lower viscosity PAO2 sho...

  2. Influence of film thickness on the morphological and electrical properties of epitaxial TiC films deposited by reactive magnetron sputtering on MgO substrates

    NASA Astrophysics Data System (ADS)

    Zoita, N. C.; Braic, V.; Danila, M.; Vlaicu, A. M.; Logofatu, C.; Grigorescu, C. E. A.; Braic, M.

    2014-03-01

    Epitaxial TiC films were deposited on MgO (001) by DC magnetron sputtering in a reactive atmosphere of Ar and CH4 at 800 °C. The films elemental composition and chemical bonding was investigated by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and micro-Raman spectroscopy. The crystallographic structure, investigated by X-ray diffraction, exhibited an increased degree of (001) orientation with the film thickness, with a cube-on-cube epitaxial relationship with the substrate. The films morphology and electrical properties were determined by atomic force microscopy (AFM) and Hall measurements in Van der Pauw geometry. The influences of the film thickness (57-545 nm) on the morphological and electrical properties were investigated. The thinnest film presented the lowest resistivity, 160 μΩ cm, showing an atomically flat surface, while higher values were obtained for the thicker films, explained by their different morphology dominated by low aspect ratio nanoislands/nanocolumns.

  3. Reaction Time and Film Thickness Effects on Phase Formation and Optical Properties of Solution Processed Cu2ZnSnS4 Thin Films

    NASA Astrophysics Data System (ADS)

    Safdar, Amna; Islam, Mohammad; Akram, Muhammad Aftab; Mujahid, Mohammad; Khalid, Yasir; Shah, S. Ismat

    2016-02-01

    Copper-zinc-tin-sulfide (Cu2ZnSnS4 or CZTS) is a promising p-type semiconductor material as absorber layer in thin film solar cells. The sulfides of copper and tin as well as zinc and sulfur powders were dissolved in hydrazine. The effect of chemical reaction between precursor species, at room temperature, was assessed for 6 to 22 h. For 22 h reaction time, the effect of spin coated film thickness on the resulting composition, after annealing under N2 flow at 500 °C for 1 h, was investigated. The morphology, composition, and optical properties of the annealed films were determined by means of x-ray diffraction, scanning electron microscope, and spectrophotometer studies. It was found that, for less than optimal reaction time of 22 h or film thickness below 1.2 µm, other ternary phases namely Cu4SnS4, Cu5Sn2S7, and ZnS co-exist in different proportions besides CZTS. Formation of phase-pure CZTS films also exhibited a tendency to minimize film cracking during annealing. Depending on the processing conditions, the band gap ( E g) values were determined to be in the range of 1.55 to 1.97 eV. For phase-pure annealed CZTS film, an increase in the E g value may be attributed to quantum confinement effect due to small crystallite size.

  4. Correlation of asperity contact-time fraction with elastohydrodynamic film thickness in a 20-millimeter-bore ball bearing

    NASA Technical Reports Server (NTRS)

    Coy, J. J.

    1979-01-01

    Elastohydrodynamic film thicknesses and asperity contact-time fractions were measured for a 20 mm bore ball bearing by using the capacitance and conductance techniques. The bearing was thrust loaded to 90, 445, and 778 N. The corresponding maximum stresses on the inner race were 1.28, 2.09, and 2.45 GPa. The test speed ranged from 400 to 15,000 rpm. The test bearing was mist lubricated with a MIL-L-23699A turbine oil. The temperature was 27 C. The experimental results were correlated to give the percent film (no-contact-time fraction) as a function of measured film thickness. Measurements were made for three test series that represented the test bearing in various conditions of run-in. The measurements show that the percent film changes with bearing run-in time. The experimental results agreed well with theoretical predictions based on surface trace analysis for a new bearing. For the run-in state, they agreed with previously reported experimental results. The results show that asperity contact existed at a film thickness-roughness ratio lambda of 6.0 or less for a new bearing. After run-in, no asperity contact occurred at a lambda of 3.5 or greater.

  5. Terahertz in-line sensor for direct coating thickness measurement of individual tablets during film coating in real-time.

    PubMed

    May, Robert K; Evans, Michael J; Zhong, Shuncong; Warr, Ian; Gladden, Lynn F; Shen, Yaochun; Zeitler, J Axel

    2011-04-01

    We present a new in-line measurement technique to determine the coating thickness of individual pharmaceutical tablets during film coating in a pan coating unit using pulsed terahertz technology. Results of these real-time terahertz measurements acquired during a production scale coating run are validated using both off-line high-resolution terahertz pulsed imaging of the whole dosage form as well as weight-gain measurements made on sample tablets removed at discrete time intervals during the process run. The terahertz measurements provide a direct method of determining the coating thickness, and no chemometric calibration models are required for the quantification. The results, and their repeatability, demonstrate that real-time monitoring of pharmaceutical tablet coating is not only possible but also provides substantially more information of the coating quality than the standard quality control method. Rather than providing the average coating thickness of a large number of tablets, the terahertz sensor provides the thickness of up to 100 individual tablet coatings per minute. Using this information, the operator can get additional information about the thickness distribution in the coating pan and adjust the process accordingly. At present, a minimum coating thickness of 40 μm is required to determine the coating thickness. The technique is applicable for coatings up to 1 mm in thickness. Within that range, it provides thickness measurements of sub-micron resolution. Terahertz in-line coating process measurements show considerable potential for applications in real-time release, process analytical technology and quality by design.

  6. Cooper-pair insulator phase in superconducting amorphous Bi films induced by nanometer-scale thickness variations

    NASA Astrophysics Data System (ADS)

    Hollen, S. M.; Nguyen, H. Q.; Rudisaile, E.; Stewart, M. D., Jr.; Shainline, J.; Xu, J. M.; Valles, J. M., Jr.

    2011-08-01

    Ultrathin films near the quantum insulator-superconductor transition (IST) can exhibit Cooper-pair transport in their insulating state. This Cooper-pair insulator (CPI) state is achieved in amorphous Bi films evaporated onto substrates with a topography varying on lengths slightly greater than the superconducting coherence length. We present evidence that this topography induces film thickness and corresponding superconducting coupling constant variations that promote Cooper-pair island formation. Analyses of many thickness-tuned ISTs show that weak links between superconducting islands dominate the transport. In particular, the IST occurs when the link resistance approaches the resistance quantum for pairs. These results support conjectures that the CPI is an inhomogeneous state of matter.

  7. An infrared pyroelectric detector improved by cool isostatic pressing with cup-shaped PZT thick film on silicon substrate

    NASA Astrophysics Data System (ADS)

    Peng, Q. X.; Wu, C. G.; Luo, W. B.; Chen, C.; Cai, G. Q.; Sun, X. Y.; Qian, D. P.

    2013-11-01

    In this paper, we presented a new pyroelectric detector with back to back silicon cups and micro-bridge structure. The PZT thick film shaped in the front cup was directly deposited with designed pattern by electrophoresis deposition (EPD). Pt/Ti Metal film, which was fabricated by standard photolithography and lift-off technology, was sputtered to connect the top electrode and the bonding pad. The cold isostatic press (CIP) treatment could be applied to improve the pyroelectric properties of PZT thick film. The infrared (IR) properties the CIP-optimized detector were measured. The voltage responsivity (RV) was 4.5 × 102 V/W at 5.3 Hz, the specific detectivity (D*) was greater than 6.34 × 108 cm Hz1/2 W-1 (frequency > 110 Hz), and the thermal time constant was 51 ms, respectively.

  8. Polycrystalline CdZnTe thick films for low energy x-ray: system evaluation.

    PubMed

    Yuk, Sunwoo; Park, Shin-Woong; Yi, Yun

    2006-01-01

    The X-ray response of polycrystalline-CdZnTe was measured by signal-to-noise (S/N) analysis. The CdZnTe material has optimal properties in a solid-state X-ray detector, and much research has focused on single crystal CdZnTe with a small-sized, silicon readout device. However, it would be difficult to apply CdTe or CdZnTe single crystal to large area, flat panel detectors, such as those used for radiography and mammography. As an alternative of single crystal CdZnTe, we have grown thick, polycrystalline CdZnTe films of high resistivity (>5 x 10(9) Ohm cm) using the thermal evaporation method on carbon substrate. A high signal-to-noise value has a direct impact on the performance of CdZnTe X-ray detectors. Important image parameters, such as dynamic range and detective quantum efficiency, rely on the signal and noise characteristics of the system. In this paper, we analyzed the properties of the X-ray detector and obtained images of the X-ray detector using the data acquisition system. The X-ray detector used the Cd1-xZnxTe (x=0.04), which used carbon substrate and gold as the electrode. The detector design is planar and 32 mm x 10 mm in size, and it has a 1.75mm x 1mm pixel electrode size and a detector thickness of 150 microm.

  9. Nanostructured SnO2 thick films for gas sensor application: analysis of structural and electronic properties

    NASA Astrophysics Data System (ADS)

    Miskovic, Goran; Aleksic, Obrad S.; Nikolic, Maria V.; Nicolics, Johann; Radosavljevic, Goran; Vasiljevic, Zorka Z.; Lukovic, Miloljub D.; Smetana, Walter

    2016-03-01

    This research is focused on structural and electrical characterisation of tin oxide (SnO2) applied as a thick film and investigation of its properties as gas sensitive material. Micron sized SnO2 powder was milled in an agate mill for six hours to fabricate SnO2 nanopowder, which was afterwards sieved by 325 mesh sieve and characterized by XRD and SEM. This powder was used as functional part in the production of thick film tin oxide paste containing a resin vehicle with 4 wt. % nanosize glass frits acting as permanent binder. The glass frits where additionally milled for twelve hours in the agate mills to nanosized powder and sieved by a 325 mesh sieve as well. The achieved thick film paste was screen printed on alumina and fired at 850oC peak temperature for 10 minutes in air. After the sintering process, thick film samples where characterized by X-ray powder diffraction (XRD) and scanning electron microscopy (SEM). The reflectivity was measured on the same samples by UV-VIS spectrophotometer: the band gap was determined from the slope of reflectance. After that a matrix of different interdigitated electrode structure of PdAg paste was printed and sintered using the mentioned sintering conditions. The tin oxide thick film was printed over the interdigitated electrodes as a top layer and sintered again under the same conditions. The total electrical resistance was measured as a function of the electrode spacing and temperature. A negative temperature coefficient (NTC) was identified and measured in the range from room temperature (27°C) to 180°C in a climate chamber. Finally the samples were placed into a gas reactor with NOx and CO gas and the resistance was measured in the same temperature range (27°C-200°C).

  10. The Effects of TI/PT Bottom Electrode on Crystallographic and Surface Characteristics of PZT Thick Films

    NASA Astrophysics Data System (ADS)

    Koochekzadeh, Ali; Keshavarz Alamdari, Eskandar; Barzegar, Abdolghafar

    The ceramic lead zirconate titanate (PZT) films near the morphotropic phase boundary are successfully integrated into MEMS devices, especially for applications in microsensors and actuators. The ferro/piezo electric properties of PZT thick films are widely dependent on its surface quality and crystallographic orientation growth. This paper indicates the influences of platinum bottom electrode on the surface and crystallographic properties of PZT. Ti (10nm) and Pt (100nm) thin films have been deposited on silicon substrate by thermal evaporation and electron beam respectively without vacuum breaking. After annealing treatment, the Pt film exhibited (111) preferred orientation. Finally one micron thick PZT (54/46) film was deposited by a RF magnetron sputtering at room temperature in pure Argon followed by a conventional post annealing treatment on silicon substrate. The XRD measurements have shown the provskite structure of PZT films with (100) preferred orientation at annealing temperatures above 600°C and (111) preferred orientation above 650°c. The SEM results demonstrate that whatever the annealing temperature is increased, recrystallization grains and black holes on Pt surface occurs and cause morphological change of PZT surface. The AFM test shows the strong RMS roughness of platinum surface after annealing temperature at 650°C.

  11. Photocatalytic activities of wet oxidation synthesized ZnO and ZnO-TiO2 thick porous films

    NASA Astrophysics Data System (ADS)

    Chen, Ruiqun; Han, Jie; Yan, Xiaodong; Zou, Chongwen; Bian, Jiming; Alyamani, Ahmed; Gao, Wei

    2011-05-01

    Highly porous zinc oxide (ZnO) film was produced by using reactive magnetron sputtering zinc target followed by wet oxidation. Titanium dioxide (TiO2) was mixed to the porous films by using either TiO2 target magnetron sputter deposition or sol-spin method. The film thickness could reach 50 μm with uniform porosity. On the sputtering prepared ZnO-TiO2 film surface, fine nanorods with small anatase TiO2 nano-clusters on the tips were observed by SEM and TEM, and the titanium (Ti) composition was determined by XPS as 0.37%. The sol-spin treatment could increase the Ti composition to 4.9%, with reduced pore size compared to the untreated ZnO porous film. Photoluminescence measurements showed that the Ti containing porous film has strong ultraviolet-visible light emission. In the photo-catalysis testing, ZnO and ZnO-TiO2 have similar photo-catalysis activity under 365 nm UV irradiation, but under visible light, the photocatalysis activities of ZnO-TiO2 films were twice higher than that of ZnO porous film, implying promising applications of this porous oxide composite for industrial and dairy farm wastewater treatment.

  12. Preparation of a high-quality PZT thick film with performance comparable to those of bulk materials for applications in MEMS

    NASA Astrophysics Data System (ADS)

    Xu, Xiao-Hui; Chu, Jia-Ru

    2008-06-01

    High-quality lead zirconate titanate (PZT) thick films have been prepared on silicon substrates by combining PZT-Si bonding and wet-etching technology. The bulk PZT wafer was first bonded to the silicon substrate using a 2 µm thick intermediate layer of epoxy resin with a bonding strength higher than 10 MPa. Then the bulk PZT was thinned by a wet-etching method. The thickness of the final PZT films depends on the etching time. The PZT thick films after being polished showed a surface roughness of about 20 nm (RMS), which can satisfy most of the requirements in MEMS. The prepared PZT thick films show a dielectric constant as high as 2400 below 100 kHz, remnant polarization of 13 µC cm-2, piezoelectric constant d31 of about -280 pm V-1 and Young's modulus of about 63 GPa. The measured electromechanical properties of the PZT thick films were comparable to those of the corresponding bulk ceramics. This approach makes it possible to obtain high-quality PZT films because it separates the PZT wafer fabrication from the target substrate and consequently allows integration of the PZT thick films onto many kinds of substrates. Finally, a self-sensing bulk PZT thick film actuator was fabricated as an example of a basic PZT-Si diaphragm structure that can be used in piezoelectric micropumps, and its sensing and actuating performances were also demonstrated.

  13. Superferrimagnetism in hard Nd-Fe-B thick films, an original concept for coercivity enhancement

    NASA Astrophysics Data System (ADS)

    Akdogan, O.; Dobrynin, A.; Le Roy, D.; Dempsey, N. M.; Givord, D.

    2014-05-01

    In a number of applications (automotive, wind generators), RFeB magnets are parts of systems which operate at temperatures in the range of 160 °C-180 °C. At these high temperatures, coercivity is preserved by substituting Dy atoms for a part of the Nd ones. The enhanced coercivity obtained may be associated to the high magnetocrystalline anisotropy of Dy atoms, which diffuse into the R2Fe14B phase. The introduction of Dy, however, induces a reduction in the remanent magnetization. Furthermore, Dy is an expensive and strategic material. In this study, we explore a radically different approach to coercivity. A magnetic layer is deposited at the surface of the hard grains, this layer being exchange coupled to the main hard phase in a way that its magnetization is antiparallel to it. Under an applied field that tends to reverse the main phase magnetization, the surface layer, the magnetization of which is along the field, works against reversal. This is the concept of superferrimagnetism. In order to test its impact on the coercivity of real systems, magnetically hard thick films of NdFeB have been sandwiched between thin layers of Gd/Fe, which were transformed to GdFe2 upon annealing. Coercivity enhancement was achieved compared to a reference NdFeB single layer.

  14. Thick-Film Hybrid Inspection With A Computer-Controlled High Resolution Imaging And Storage System

    NASA Astrophysics Data System (ADS)

    Arlan, L.; Cantella, M. J.; Dudziak, T. J.; Krayewsky, M. F.

    1980-05-01

    We have shown that an electro-optical system can be used for automatic quality control inspection of thick-film hybrid circuits. This work was supported by the U.S. Army Electronics R&D Command under Contract No. DAAB07-77-C-0585 entitled "Automatic In-Process Microcircuit Evaluation." A high resolution (10,000 TVL/H) Return Beam Viaicon (RBV) is used to image an entire 2-inch by 2-inch substrate. The RBV is operated witn computer controlled electronic steering and zoom to provide an appropriate level of detail for rapid sequential frame inspection. Video from each frame is compared with that trom a referenced image stored on a video disc. Differences are displayed on a color TV monitor and processed by the computer to identify and characterize faults. Various manual ana automatic inspection sequences can be programmed readily. This technique can inspect hybrid substrates at rates of 750 per hour, and its efficiency makes 100% inspection an economical method for quality control at high through-put rates. This paper describes tree hardware instrumentation and reports functional inspection results achievea using sample hybrid circuits with built-in flaws.

  15. Low-cost carbon thick-film strain sensors for implantable applications

    NASA Astrophysics Data System (ADS)

    Gutierrez, Christian A.; Meng, Ellis

    2010-09-01

    The suitability of low-cost carbon thick-film strain sensors embedded within a biomedical grade silicone rubber (Silastic® MDX4-4210) for implantable applications is investigated. These sensors address the need for robust cost-effective implantable strain sensing technology for the closed loop operation of function-restoring neural prosthetic systems. Design, fabrication and characterization of the sensors are discussed in the context of the application to strain/fullness measurements of the urinary bladder as part of the neuroprosthetic treatment of lower urinary tract dysfunction. The fabrication process, utilizing off-the-shelf screen-printing materials, is convenient and cost effective while achieving resolutions down to 75 µm. This method can also be extended to produce multilayer embedded devices by superposition of different screen-printable materials. Uniaxial loading performance, temperature dependence and long-term soak testing are used to validate suitability for implantation while proof-of-concept operation (up to 40% strain) is demonstrated on a bench-top latex balloon bladder model.

  16. Dependencies of microstructure and stress on the thickness of GdBa2Cu3O7 − δ thin films fabricated by RF sputtering

    PubMed Central

    2013-01-01

    GdBa2Cu3O7 − δ (GdBCO) films with different thicknesses from 200 to 2,100 nm are deposited on CeO2/yttria-stabilized zirconia (YSZ)/CeO2-buffered Ni-W substrates by radio-frequency magnetron sputtering. Both the X-ray diffraction and scanning electron microscopy analyses reveal that the a-axis grains appear at the upper layers of the films when the thickness reaches to 1,030 nm. The X-ray photoelectron spectroscopy measurement implies that the oxygen content is insufficient in upper layers beyond 1,030 nm for a thicker film. The Williamson-Hall method is used to observe the variation of film stress with increasing thickness of our films. It is found that the highest residual stresses exist in the thinnest film, while the lowest residual stresses exist in the 1,030-nm-thick film. With further increasing film thickness, the film residual stresses increase again. However, the critical current (Ic) of the GdBCO film first shows a nearly linear increase and then shows a more slowly enhancing to a final stagnation as film thickness increases from 200 to 1,030 nm and then to 2,100 nm. It is concluded that the roughness and stress are not the main reasons which cause the slow or no increase in Ic. Also, the thickness dependency of GdBa2Cu3O7 − δ films on the Ic is attributed to three main factors: a-axis grains, gaps between a-axis grains, and oxygen deficiency for the upper layers of a thick film. PMID:23816137

  17. Performance of all-metal demountable cryogenic seals at superfluid helium temperatures

    NASA Technical Reports Server (NTRS)

    Salerno, L. J.; Kittel, P. L.; Spivak, A. L.

    1991-01-01

    Two all-metal demountable cryogenic seals with an outside diameter of 36.6 mm, inside diameter of 27.2 mm and thickness of 0.51 mm were leak-tested at room temperature (300 K), liquid nitrogen temperature (21 cycles at 77 K), liquid helium temperature (nine cycles at 4.2K) and superfluid helium temperature (four cycles at 1.6 K). Each seal was mounted and demounted for 13 cycles. Thickness measurements at 90 deg intervals along the circumference showed a maximum seal compression of 0.038 mm. Leak rate measurements at all temperatures showed no detectable leak above the helium background level, typically 0.1 x 10 exp -9 std cu cm/s, during testing.

  18. Performance of all-metal demountable cryogenic seals at superfluid helium temperatures

    NASA Technical Reports Server (NTRS)

    Salerno, Louis J.; Kittel, Peter; Spivak, Alan L.

    1989-01-01

    Two all-metal demountable cryogenic seals with an outside diameter of 36.6 mm, inside diameter of 27.2 mm, and thickness of 0.51 mm were leak-tested at room temperature (300 K), liquid nitrogen temperature (21 cycles at 77 K), liquid helium temperature (9 cycles at 4.2 K), and superfluid helium temperature (4 cycles at 1.6 K). Each seal was mounted and demounted for 13 cycles. Thickness measurements at 90 deg intervals along the circumference showed a maximum seal compression of 0.038 mm. Leak-rate measurements at all temperatures showed no detectable leak above the helium background level, typically 0.1 x 10(-9) std-cc/sec, during testing.

  19. Performance of all-metal demountable cryogenic seals at superfluid helium temperatures

    NASA Technical Reports Server (NTRS)

    Salerno, Louis J.; Spivak, Alan L.; Kittel, Peter

    1989-01-01

    Two all-metal demountable cryogenic seals with an outside diameter of 36.6 mm, inside diameter of 27.2 mm, and thickness of 0.51 mm were leak-tested at room temperature (300 K), liquid nitrogen temperature (21 cycles at 77 K), liquid helium temperature (9 cycles at 4.2 K), and susperfluid helium temperature (4 cycles at 1.6 K). Each seal was mounted and demounted for 13 cycles. Thickness measurements at 90 deg intervals along the circumference showed a maximum seal compression of 0.038 mm. Leak-rate measurements at all temperatures showed no detectable leak above the helium background level, typically 0.1 x 10(-9) std-cc/sec, during testing.

  20. Water film thickness-dependent conformation and diffusion of single-strand DNA on poly(ethylene glycol)-silane surface

    PubMed Central

    Park, Jae Hyun; Aluru, N. R.

    2010-01-01

    In this paper, we investigate, using molecular dynamics simulations, the conformation and diffusion of longer and shorter single-strand DNA (ssDNA) as a function of water film thickness. While the conformation of the shorter ssDNA is significantly affected and the diffusion is suppressed with reduction in water film thickness, the conformation and diffusion of the longer DNA is not influenced. We explain our observations by considering the competition between stacking interaction of bases and solvation tendency of ssDNA. This paper suggests an approach to control the surface motion of ssDNA in nanoscale water films using film thickness. PMID:20404938