Sample records for circuit component testing

  1. Split-cross-bridge resistor for testing for proper fabrication of integrated circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G. (Inventor)

    1985-01-01

    An electrical testing structure and method is described whereby a test structure is fabricated on a large scale integrated circuit wafer along with the circuit components and has a van der Pauw cross resistor in conjunction with a bridge resistor and a split bridge resistor, the latter having two channels each a line width wide, corresponding to the line width of the wafer circuit components, and with the two channels separated by a space equal to the line spacing of the wafer circuit components. The testing structure has associated voltage and current contact pads arranged in a two by four array for conveniently passing currents through the test structure and measuring voltages at appropriate points to calculate the sheet resistance, line width, line spacing, and line pitch of the circuit components on the wafer electrically.

  2. Electronic test and calibration circuits, a compilation

    NASA Technical Reports Server (NTRS)

    1972-01-01

    A wide variety of simple test calibration circuits are compiled for the engineer and laboratory technician. The majority of circuits were found inexpensive to assemble. Testing electronic devices and components, instrument and system test, calibration and reference circuits, and simple test procedures are presented.

  3. Expedition 18 Station Development Test Objectives (STDO) Session 1

    NASA Image and Video Library

    2009-02-19

    ISS018-E-033816 (19 Feb. 2009) --- Astronaut Michael Fincke, Expedition 18 commander, removes, cleans and replaces electronic test components on a single test card using Component Repair Equipment (CRE-1) hardware in a portable glovebox facility in the Harmony node of the International Space Station. Fincke unsoldered 1 1/2 components from an integrated circuit board and re-soldered new components including an integrated circuit chip.

  4. Expedition 18 Station Development Test Objectives (STDO) Session 1

    NASA Image and Video Library

    2009-02-19

    ISS018-E-033818 (19 Feb. 2009) --- Astronaut Michael Fincke, Expedition 18 commander, removes, cleans and replaces electronic test components on a single test card using Component Repair Equipment (CRE-1) hardware in a portable glovebox facility in the Harmony node of the International Space Station. Fincke unsoldered 1 1/2 components from an integrated circuit board and re-soldered new components including an integrated circuit chip.

  5. Lithium Circuit Test Section Design and Fabrication

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas; Garber, Anne

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper will discuss the overall system design and build and the component testing findings.

  6. Lithium Circuit Test Section Design and Fabrication

    NASA Astrophysics Data System (ADS)

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  7. 76 FR 9374 - Proposed Extension of Existing Information Collection; Examinations and Testing of Electrical...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2011-02-17

    ... related detached components; 75.800-4 Testing, examination and maintenance of circuit breakers; record; 75...-4 Testing, examination and maintenance of circuit breakers; record; 75.1001-1 Devices for..., testing, and maintenance; 77.800-2 Testing, examination and maintenance of circuit breakers; record; and...

  8. A programmable heater control circuit for spacecraft

    NASA Technical Reports Server (NTRS)

    Nguyen, D. D.; Owen, J. W.; Smith, D. A.; Lewter, W. J.

    1994-01-01

    Spacecraft thermal control is accomplished for many components through use of multilayer insulation systems, electrical heaters, and radiator systems. The heaters are commanded to maintain component temperatures within design specifications. The programmable heater control circuit (PHCC) was designed to obtain an effective and efficient means of spacecraft thermal control. The hybrid circuit provides use of control instrumentation as temperature data, available to the spacecraft central data system, reprogramming capability of the local microprocessor during the spacecraft's mission, and the elimination of significant spacecraft wiring. The hybrid integrated circuit has a temperature sensing and conditioning circuit, a microprocessor, and a heater power and control circuit. The device is miniature and housed in a volume which allows physical integration with the component to be controlled. Applications might include alternate battery-powered logic-circuit configurations. A prototype unit with appropriate physical and functional interfaces was procured for testing. The physical functionality and the feasibility of fabrication of the hybrid integrated circuit were successfully verified. The remaining work to develop a flight-qualified device includes fabrication and testing of a Mil-certified part. An option for completing the PHCC flight qualification testing is to enter into a joint venture with industry.

  9. Documentation of Stainless Steel Lithium Circuit Test Section Design. Suppl

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas J. (Compiler); Martin, James J.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations

  10. Documentation of Stainless Steel Lithium Circuit Test Section Design

    NASA Technical Reports Server (NTRS)

    Godfroy, T. J.; Martin, J. J.; Stewart, E. T.; Rhys, N. O.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.

  11. High density electronic circuit and process for making

    DOEpatents

    Morgan, William P.

    1999-01-01

    High density circuits with posts that protrude beyond one surface of a substrate to provide easy mounting of devices such as integrated circuits. The posts also provide stress relief to accommodate differential thermal expansion. The process allows high interconnect density with fewer alignment restrictions and less wasted circuit area than previous processes. The resulting substrates can be test platforms for die testing and for multi-chip module substrate testing. The test platform can contain active components and emulate realistic operational conditions, replacing shorts/opens net testing.

  12. High density electronic circuit and process for making

    DOEpatents

    Morgan, W.P.

    1999-06-29

    High density circuits with posts that protrude beyond one surface of a substrate to provide easy mounting of devices such as integrated circuits are disclosed. The posts also provide stress relief to accommodate differential thermal expansion. The process allows high interconnect density with fewer alignment restrictions and less wasted circuit area than previous processes. The resulting substrates can be test platforms for die testing and for multi-chip module substrate testing. The test platform can contain active components and emulate realistic operational conditions, replacing shorts/opens net testing. 8 figs.

  13. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Marques, J.G.; Ramos, A.R.; Fernandes, A.C.

    The behavior of electronic components and circuits under radiation is a concern shared by the nuclear industry, the space community and the high-energy physics community. Standard commercial components are used as much as possible instead of radiation hard components, since they are easier to obtain and allow a significant reduction of costs. However, these standard components need to be tested in order to determine their radiation tolerance. The Portuguese Research Reactor (RPI) is a 1 MW pool-type reactor, operating since 1961. The irradiation of electronic components and circuits is one area where a 1 MW reactor can be competitive, sincemore » the fast neutron fluences required for testing are in most cases well below 10{sup 16} n/cm{sup 2}. A program was started in 1999 to test electronics components and circuits for the LHC facility at CERN, initially using a dedicated in-pool irradiation device and later a beam line with tailored neutron and gamma filters. Neutron filters are essential to reduce the intensity of the thermal neutron flux, which does not produce significant defects in electronic components but produces unwanted radiation from activation of contacts and packages of integrated circuits and also of the printed circuit boards. In irradiations performed within the line-of-sight of the core of a fission reactor there is simultaneous gamma radiation which complicates testing in some cases. Filters can be used to reduce its importance and separate testing with a pure gamma radiation source can contribute to clarify some irradiation results. Practice has shown the need to introduce several improvements to the procedures and facilities over the years. We will review improvements done in the following areas: - Optimization of neutron and gamma filters; - Dosimetry procedures in mixed neutron / gamma fields; - Determination of hardness parameter and 1 MeV-equivalent neutron fluence; - Temperature measurement and control during irradiation; - Follow-up of reactor power operational fluctuations; - Study of gamma radiation effects only. The fission neutron spectrum can be limitative for some of the tests, as most neutrons are in the 1-2 MeV energy range. Significant progress has been made lately in compact neutron generators using D-D and D-T fusion reactions, achieving higher neutron fluxes and longer lifetime than previously available. The advantages of using compact neutron generators for testing of electronic components and circuits will be also discussed. (authors)« less

  14. Crossed SMPS MOSFET-based protection circuit for high frequency ultrasound transceivers and transducers

    PubMed Central

    2014-01-01

    Background The ultrasonic transducer is one of the core components of ultrasound systems, and the transducer’s sensitivity is significantly related the loss of electronic components such as the transmitter, receiver, and protection circuit. In an ultrasonic device, protection circuits are commonly used to isolate the electrical noise between an ultrasound transmitter and transducer and to minimize unwanted discharged pulses in order to protect the ultrasound receiver. However, the performance of the protection circuit and transceiver obviously degrade as the operating frequency or voltage increases. We therefore developed a crossed SMPS (Switching Mode Power Supply) MOSFET-based protection circuit in order to maximize the sensitivity of high frequency transducers in ultrasound systems. The high frequency pulse signals need to trigger the transducer, and high frequency pulse signals must be received by the transducer. We therefore selected the SMPS MOSFET, which is the main component of the protection circuit, to minimize the loss in high frequency operation. The crossed configuration of the protection circuit can drive balanced bipolar high voltage signals from the pulser and transfer the balanced low voltage echo signals from the transducer. Methods The equivalent circuit models of the SMPS MOSFET-based protection circuit are shown in order to select the proper device components. The schematic diagram and operation mechanism of the protection circuit is provided to show how the protection circuit is constructed. The P-Spice circuit simulation was also performed in order to estimate the performance of the crossed MOSFET-based protection circuit. Results We compared the performance of our crossed SMPS MOSFET-based protection circuit with a commercial diode-based protection circuit. At 60 MHz, our expander and limiter circuits have lower insertion loss than the commercial diode-based circuits. The pulse-echo test is typical method to evaluate the sensitivity of ultrasonic transducers. Therefore, we performed a pulse-echo test using a single element transducer in order to utilize the crossed SMPS MOSFET-based protection circuit in an ultrasound system. Conclusions The SMPS-based protection circuit could be a viable alternative that provides better sensitivity, especially for high frequency ultrasound applications. PMID:24924595

  15. Crossed SMPS MOSFET-based protection circuit for high frequency ultrasound transceivers and transducers.

    PubMed

    Choi, Hojong; Shung, K Kirk

    2014-06-12

    The ultrasonic transducer is one of the core components of ultrasound systems, and the transducer's sensitivity is significantly related the loss of electronic components such as the transmitter, receiver, and protection circuit. In an ultrasonic device, protection circuits are commonly used to isolate the electrical noise between an ultrasound transmitter and transducer and to minimize unwanted discharged pulses in order to protect the ultrasound receiver. However, the performance of the protection circuit and transceiver obviously degrade as the operating frequency or voltage increases. We therefore developed a crossed SMPS (Switching Mode Power Supply) MOSFET-based protection circuit in order to maximize the sensitivity of high frequency transducers in ultrasound systems.The high frequency pulse signals need to trigger the transducer, and high frequency pulse signals must be received by the transducer. We therefore selected the SMPS MOSFET, which is the main component of the protection circuit, to minimize the loss in high frequency operation. The crossed configuration of the protection circuit can drive balanced bipolar high voltage signals from the pulser and transfer the balanced low voltage echo signals from the transducer. The equivalent circuit models of the SMPS MOSFET-based protection circuit are shown in order to select the proper device components. The schematic diagram and operation mechanism of the protection circuit is provided to show how the protection circuit is constructed. The P-Spice circuit simulation was also performed in order to estimate the performance of the crossed MOSFET-based protection circuit. We compared the performance of our crossed SMPS MOSFET-based protection circuit with a commercial diode-based protection circuit. At 60 MHz, our expander and limiter circuits have lower insertion loss than the commercial diode-based circuits. The pulse-echo test is typical method to evaluate the sensitivity of ultrasonic transducers. Therefore, we performed a pulse-echo test using a single element transducer in order to utilize the crossed SMPS MOSFET-based protection circuit in an ultrasound system. The SMPS-based protection circuit could be a viable alternative that provides better sensitivity, especially for high frequency ultrasound applications.

  16. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Tanaka, T.J.; Nowlen, S.P.; Anderson, D.J.

    Smoke can adversely affect digital electronics; in the short term, it can lead to circuit bridging and in the long term to corrosion of metal parts. This report is a summary of the work to date and component-level tests by Sandia National Laboratories for the Nuclear Regulatory Commission to determine the impact of smoke on digital instrumentation and control equipment. The component tests focused on short-term effects such as circuit bridging in typical components and the factors that can influence how much the smoke will affect them. These factors include the component technology and packaging, physical board protection, and environmentalmore » conditions such as the amount of smoke, temperature of burn, and humidity level. The likelihood of circuit bridging was tested by measuring leakage currents and converting those currents to resistance in ohms. Hermetically sealed ceramic packages were more resistant to smoke than plastic packages. Coating the boards with an acrylic spray provided some protection against circuit bridging. The smoke generation factors that affect the resistance the most are humidity, fuel level, and burn temperature. The use of CO{sub 2} as a fire suppressant, the presence of galvanic metal, and the presence of PVC did not significantly affect the outcome of these results.« less

  17. E-learning platform for automated testing of electronic circuits using signature analysis method

    NASA Astrophysics Data System (ADS)

    Gherghina, Cǎtǎlina; Bacivarov, Angelica; Bacivarov, Ioan C.; Petricǎ, Gabriel

    2016-12-01

    Dependability of electronic circuits can be ensured only through testing of circuit modules. This is done by generating test vectors and their application to the circuit. Testability should be viewed as a concerted effort to ensure maximum efficiency throughout the product life cycle, from conception and design stage, through production to repairs during products operating. In this paper, is presented the platform developed by authors for training for testability in electronics, in general and in using signature analysis method, in particular. The platform allows highlighting the two approaches in the field namely analog and digital signature of circuits. As a part of this e-learning platform, it has been developed a database for signatures of different electronic components meant to put into the spotlight different techniques implying fault detection, and from this there were also self-repairing techniques of the systems with this kind of components. An approach for realizing self-testing circuits based on MATLAB environment and using signature analysis method is proposed. This paper analyses the benefits of signature analysis method and simulates signature analyzer performance based on the use of pseudo-random sequences, too.

  18. Initial Testing of the Stainless Steel NaK-Cooled Circuit (SNaKC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne; Godfroy, Thomas

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK) was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around the 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. This presentation addresses the construction, fill and initial testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  19. Energy and Timing Measurement with Time-Based Detector Readout for PET Applications: Principle and Validation with Discrete Circuit Components

    PubMed Central

    Sun, Xishan; Lan, Allan K.; Bircher, Chad; Deng, Zhi; Liu, Yinong; Shao, Yiping

    2011-01-01

    A new signal processing method for PET application has been developed, with discrete circuit components to measure energy and timing of a gamma interaction based solely on digital timing processing without using an amplitude-to-digital convertor (ADC) or a constant fraction discriminator (CFD). A single channel discrete component time-based readout (TBR) circuit was implemented in a PC board. Initial circuit functionality and performance evaluations have been conducted. Accuracy and linearity of signal amplitude measurement were excellent, as measured with test pulses. The measured timing accuracy from test pulses reached to less than 300 ps, a value limited mainly by the timing jitter of the prototype electronics circuit. Both suitable energy and coincidence timing resolutions (~18% and ~1.0 ns) have been achieved with 3 × 3 × 20 mm3 LYSO scintillator and photomultiplier tube-based detectors. With its relatively simple circuit and low cost, TBR is expected to be a suitable front-end signal readout electronics for compact PET or other radiation detectors requiring the reading of a large number of detector channels and demanding high performance for energy and timing measurement. PMID:21743761

  20. Evaluation of biasing and protection circuitry components for cryogenic MMIC low-noise amplifiers

    NASA Astrophysics Data System (ADS)

    Lamb, James W.

    2014-05-01

    Millimeter-wave integrated circuits with gate lengths as short as 35 nm are demonstrating extremely low-noise performance, especially when cooled to cryogenic temperatures. These operate at low voltages and are susceptible to damage from electrostatic discharge and improper biasing, as well as being sensitive to low-level interference. Designing a protection circuit for low voltages and temperatures is challenging because there is very little data available on components that may be suitable. Extensive testing at low temperatures yielded a set of components and a circuit topology that demonstrates the required level of protection for critical MMICs and similar devices. We present a circuit that provides robust protection for low voltage devices from room temperature down to 4 K.

  1. OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

    NASA Astrophysics Data System (ADS)

    Khade, R. H.; Chaudhari, D. S.

    2018-03-01

    In this paper, oscillation-based built-in self-test method is used to diagnose catastrophic and parametric faults in integrated circuits. Sallen-Key low pass filter and high pass filter circuits with different gains are used to investigate defects. Variation in seven parameters of operational amplifier (OP-AMP) like gain, input impedance, output impedance, slew rate, input bias current, input offset current, input offset voltage and catastrophic as well as parametric defects in components outside OP-AMP are introduced in the circuit and simulation results are analysed. Oscillator output signal is converted to pulses which are used to generate a signature of the circuit. The signature and pulse count changes with the type of fault present in the circuit under test (CUT). The change in oscillation frequency is observed for fault detection. Designer has flexibility to predefine tolerance band of cut-off frequency and range of pulses for which circuit should be accepted. The fault coverage depends upon the required tolerance band of the CUT. We propose a modification of sensitivity of parameter (pulses) to avoid test escape and enhance yield. Result shows that the method provides 100% fault coverage for catastrophic faults.

  2. Evaluation of test equipment for the detection of contamination on electronic circuits

    NASA Astrophysics Data System (ADS)

    Bergendahl, C. G.; Dunn, B. D.

    1984-08-01

    The reproducibility, sensitivity and ease of operation of test equipment for the detection of ionizable contaminants on the surface of printed circuit assemblies were assessed. The characteristics of the test equipment are described. Soldering fluxes were chosen as contaminants and were applied in controlled amounts to printed-circuit board assemblies possessing two different component populations. Results show that the relationship between equipment readings varies with flux type. Each kind of test equipment gives a good measure of board cleanliness, although reservations exist concerning the interpretation of such results. A test method for the analysis of total (organic and inorganic) halides in solder fluxes is presented.

  3. Capabilities and Testing of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK), which was used in the SNAP-10A fission reactor, was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around a 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. NaK flow rates of greater than 1 kg/sec may be achieved, depending upon the power applied to the EM pump. The heat exchanger provides for the removal of thermal energy from the circuit, simulating the presence of an energy conversion system. The presence of the test section increases the versatility of the circuit. A second liquid metal pump, an energy conversion system, and highly instrumented thermal simulators are all being considered for inclusion within the test section. This paper summarizes the capabilities and ongoing testing of the Fission Surface Power Primary Test Circuit (FSP-PTC).

  4. Long life assurance study for manned spacecraft long life hardware. Volume 2: Long life assurance studies of EEE parts and packaging

    NASA Technical Reports Server (NTRS)

    1972-01-01

    Guidelines for the design, development, and fabrication of electronic components and circuits for use in spacecraft construction are presented. The subjects discussed involve quality control procedures and test methodology for the following subjects: (1) monolithic integrated circuits, (2) hybrid integrated circuits, (3) transistors, (4) diodes, (5) tantalum capacitors, (6) electromechanical relays, (7) switches and circuit breakers, and (8) electronic packaging.

  5. TECHNICAL DESIGN NOTE: Picosecond resolution programmable delay line

    NASA Astrophysics Data System (ADS)

    Suchenek, Mariusz

    2009-11-01

    The note presents implementation of a programmable delay line for digital signals. The tested circuit has a subnanosecond delay range programmable with a resolution of picoseconds. Implementation of the circuit was based on low-cost components, easily available on the market.

  6. Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

    NASA Technical Reports Server (NTRS)

    Garber, A.; Godfroy, T.; Webster, K.

    2007-01-01

    Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  7. Gas electron multiplier (GEM) foil test, repair and effective gain calculation

    NASA Astrophysics Data System (ADS)

    Tahir, Muhammad; Zubair, Muhammad; Khan, Tufail A.; Khan, Ashfaq; Malook, Asad

    2018-06-01

    The focus of my research is based on the gas electron multiplier (GEM) foil test, repairing and effective gain calculation of GEM detector. During my research work define procedure of GEM foil testing short-circuit, detection short-circuits in the foil. Study different ways to remove the short circuits in the foils. Set and define the GEM foil testing procedures in the open air, and with nitrogen gas. Measure the leakage current of the foil and applying different voltages with specified step size. Define the Quality Control (QC) tests and different components of GEM detectors before assembly. Calculate the effective gain of GEM detectors using 109Cd and 55Fe radioactive source.

  8. Advanced Space Suit PLSS 2.0 Cooling Loop Evaluation and PLSS 2.5 Recommendations

    NASA Technical Reports Server (NTRS)

    Steele, John; Quinn, Greg; Campbell, Colin; Makinen, Janice; Watts, Carly; Westheimer, Dave

    2016-01-01

    From 2012 to 2015 The NASA/JSC AdvSS (Advanced Space Suit) PLSS (Primary Life Support Subsystem) team, with support from UTC Aerospace Systems, performed the build-up, packaging and testing of PLSS 2.0. A key aspect of that testing was the evaluation of the long-term health of the water cooling circuit and the interfacing components. Intermittent and end-of-test water, residue and hardware analyses provided valuable information on the status of the water cooling circuit, and the approaches that would be necessary to enhance water cooling circuit health in the future. The evaluated data has been consolidated, interpreted and woven into an action plan for the maintenance of water cooling circuit health for the planned FY (fiscal year) 2016 through FY 2018 PLSS 2.5 testing. This paper provides an overview of the PLSS 2.0 water cooling circuit findings and the associated steps to be taken in that regard for the PLSS 2.5 testing.

  9. Thermometry and thermal management of carbon nanotube circuits

    NASA Astrophysics Data System (ADS)

    Mayle, Scott; Gupta, Tanuj; Davis, Sam; Chandrasekhar, Venkat; Shafraniuk, Serhii

    2015-05-01

    Monitoring of the intrinsic temperature and the thermal management is discussed for the carbon nanotube nano-circuits. The experimental results concerning fabricating and testing of a thermometer able to monitor the intrinsic temperature on nanoscale are reported. We also suggest a model which describes a bi-metal multilayer system able to filter the heat flow, based on separating the electron and phonon components one from another. The bi-metal multilayer structure minimizes the phonon component of the heat flow, while retaining the electronic part. The method allows one to improve the overall performance of the electronic nano-circuits due to minimizing the energy dissipation.

  10. Advanced Space Suit PLSS 2.0 Cooling Loop Evaluation and PLSS 2.5 Recommendations

    NASA Technical Reports Server (NTRS)

    Steele, John; Quinn, Greg; Campbell, Colin; Makinen, Janice; Watts, Carly; Westheimer, David

    2016-01-01

    From 2012 to 2015 The NASA/JSC AdvSS (Advanced Space Suit) PLSS (Portable Life Support Subsystem) team, with support from UTC Aerospace Systems, performed the build-up, packaging and testing of PLSS 2.0. One aspect of that testing was the evaluation of the long-term health of the water cooling circuit and the interfacing components. Periodic and end-of-test water, residue and hardware analyses provided valuable information on the status of the water cooling circuit, and the approaches that would be necessary to enhance water cooling circuit health in the future. The evaluated data has been consolidated, interpreted and woven into an action plan for the maintenance of water cooling circuit health for the planned FY (fiscal year) 2016 through FY 2018 PLSS 2.5 testing. This paper provides an overview of the PLSS 2.0 water cooling circuit findings and the associated steps to be taken in that regard for the PLSS 2.5.

  11. Microwave Photonic Architecture for Direction Finding of LPI Emitters: Front End Analog Circuit Design and Component Characterization

    DTIC Science & Technology

    2016-09-01

    design to control the phase shifters was complex, and the calibration process was time consuming. During the redesign process, we carried out...signals in time domain with a maximum sampling frequency of 20 Giga samples per second. In the previous tests of the design , the performance of...PHOTONIC ARCHITECTURE FOR DIRECTION FINDING OF LPI EMITTERS: FRONT-END ANALOG CIRCUIT DESIGN AND COMPONENT CHARACTERIZATION by Chew K. Tan

  12. Stainless Steel NaK-Cooled Circuit (SNaKC) Fabrication and Assembly

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas J.

    2007-01-01

    An actively pumped Stainless Steel NaK Circuit (SNaKC) has been designed and fabricated by the Early Flight Fission Test Facility (EFF-TF) team at NASA's Marshall Space Flight Center. This circuit uses the eutectic mixture of sodium and potassium (NaK) as the working fluid building upon the experience and accomplishments of the SNAP reactor program from the late 1960's The SNaKC enables valuable experience and liquid metal test capability to be gained toward the goal of designing and building an affordable surface power reactor. The basic circuit components include a simulated reactor core a NaK to gas heat exchanger, an electromagnetic (EM) liquid metal pump, a liquid metal flow meter, an expansion reservoir and a drain/fill reservoir To maintain an oxygen free environment in the presence of NaK, an argon system is utilized. A helium and nitrogen system are utilized for core, pump, and heat exchanger operation. An additional rest section is available to enable special component testing m an elevated temperature actively pumped liquid metal environment. This paper summarizes the physical build of the SNaKC the gas and pressurization systems, vacuum systems, as well as instrumentation and control methods.

  13. Computational Investigation of Helical Traveling Wave Tube Transverse RF Field Forces

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A.

    1998-01-01

    In a previous study using a fully three-dimensional (3D) helical slow-wave circuit cold- test model it was found, contrary to classical helical circuit analyses, that transverse FF electric fields have significant amplitudes compared with the longitudinal component. The RF fields obtained using this helical cold-test model have been scaled to correspond to those of an actual TWT. At the output of the tube, RF field forces reach 61%, 26% and 132% for radial, azimuthal and longitudinal components, respectively, compared to radial space charge forces indicating the importance of considering them in the design of electron beam focusing.

  14. Developing a 300C Analog Tool for EGS

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Normann, Randy

    2015-03-23

    This paper covers the development of a 300°C geothermal well monitoring tool for supporting future EGS (enhanced geothermal systems) power production. This is the first of 3 tools planed. This is an analog tool designed for monitoring well pressure and temperature. There is discussion on 3 different circuit topologies and the development of the supporting surface electronics and software. There is information on testing electronic circuits and component. One of the major components is the cable used to connect the analog tool to the surface.

  15. Understanding the Design, Function and Testing of Relays

    ERIC Educational Resources Information Center

    Adams, Roger E.; Lindbloom, Trent

    2006-01-01

    The increased use of electronics in today's automobiles has complicated the control of circuits and actuators. Manufacturers use relays to control a variety of complex circuits--for example, those involving actuators and other components like the A/C clutch, electronic cooling fans, and blower motors. Relays allow a switch or processor to control…

  16. Inkjet deposited circuit components

    NASA Astrophysics Data System (ADS)

    Bidoki, S. M.; Nouri, J.; Heidari, A. A.

    2010-05-01

    All-printed electronics as a means of achieving ultra-low-cost electronic circuits has attracted great interest in recent years. Inkjet printing is one of the most promising techniques by which the circuit components can be ultimately drawn (i.e. printed) onto the substrate in one step. Here, the inkjet printing technique was used to chemically deposit silver nanoparticles (10-200 nm) simply by ejection of silver nitrate and reducing solutions onto different substrates such as paper, PET plastic film and textile fabrics. The silver patterns were tested for their functionality to work as circuit components like conductor, resistor, capacitor and inductor. Different levels of conductivity were achieved simply by changing the printing sequence, inks ratio and concentration. The highest level of conductivity achieved by an office thermal inkjet printer (300 dpi) was 5.54 × 105 S m-1 on paper. Inkjet deposited capacitors could exhibit a capacitance of more than 1.5 nF (parallel plate 45 × 45 mm2) and induction coils displayed an inductance of around 400 µH (planar coil 10 cm in diameter). Comparison of electronic performance of inkjet deposited components to the performance of conventionally etched items makes the technique highly promising for fabricating different printed electronic devices.

  17. Configurable test bed design for nanosats to qualify commercial and customized integrated circuits

    NASA Astrophysics Data System (ADS)

    Guareschi, W.; Azambuja, J.; Kastensmidt, F.; Reis, R.; Durao, O.; Schuch, N.; Dessbesel, G.

    The use of small satellites has increased substantially in recent years due to the reduced cost of their development and launch, as well to the flexibility offered by commercial components. The test bed is a platform that allows components to be evaluated and tested in space. It is a flexible platform, which can be adjusted to a wide quantity of components and interfaces. This work proposes the design and implementation of a test bed suitable for test and evaluation of commercial circuits used in nanosatellites. The development of such a platform allows developers to reduce the efforts in the integration of components and therefore speed up the overall system development time. The proposed test bed is a configurable platform implemented using a Field Programmable Gate Array (FPGA) that controls the communication protocols and connections to the devices under test. The Flash-based ProASIC3E FPGA from Microsemi is used as a control system. This adaptive system enables the control of new payloads and softcores for test and validation in space. Thus, the integration can be easily performed through configuration parameters. It is intended for modularity. Each component connected to the test bed can have a specific interface programmed using a hardware description language (HDL). The data of each component is stored in embedded memories. Each component has its own memory space. The size of the allocated memory can be also configured. The data transfer priority can be set and packaging can be added to the logic, when needed. Communication with peripheral devices and with the Onboard Computer (OBC) is done through the pre-implemented protocols, such as I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface) and external memory control. In loco primary tests demonstrated the control system's functionality. The commercial ProASIC3E FPGA family is not space-flight qualified, but tests have been made under Total Ionizing Dose (TID) showing its robustness up to 25 kr- ds (Si). When considering proton and heavy ions, flash-based FPGAs provide immunity to configuration loss and low bit-flips susceptibility in flash memory. In this first version of the test bed two components are connected to the controller FPGA: a commercial magnetometer and a hardened test chip. The embedded FPGA implements a Single Event Effects (SEE) hardened microprocessor and few other soft-cores to be used in space. This test bed will be used in the NanoSatC-BR1, the first Brazilian Cubesat scheduled to be launched in mid-2013.

  18. Cryogenic applications of commercial electronic components

    NASA Astrophysics Data System (ADS)

    Buchanan, Ernest D.; Benford, Dominic J.; Forgione, Joshua B.; Harvey Moseley, S.; Wollack, Edward J.

    2012-10-01

    We have developed a range of techniques useful for constructing analog and digital circuits for operation in a liquid Helium environment (4.2 K), using commercially available low power components. The challenges encountered in designing cryogenic electronics include finding components that can function usefully in the cold and possess low enough power dissipation so as not to heat the systems they are designed to measure. From design, test, and integration perspectives it is useful for components to operate similarly at room and cryogenic temperatures; however this is not a necessity. Some of the circuits presented here have been used successfully in the MUSTANG [1] and in the GISMO [2] camera to build a complete digital to analog multiplexer (which will be referred to as the Cryogenic Address Driver board). Many of the circuit elements described are of a more general nature rather than specific to the Cryogenic Address Driver board, and were studied as a part of a more comprehensive approach to addressing a larger set of cryogenic electronic needs.

  19. Cryogenic Applications of Commercial Electronic Components

    NASA Technical Reports Server (NTRS)

    Buchanan, Ernest D.; Benford, Dominic J.; Forgione, Joshua B.; Moseley, S. Harvey; Wollack, Edward J.

    2012-01-01

    We have developed a range of techniques useful for constructing analog and digital circuits for operation in a liquid Helium environment (4.2K), using commercially available low power components. The challenges encountered in designing cryogenic electronics include finding components that can function usefully in the cold and possess low enough power dissipation so as not to heat the systems they are designed to measure. From design, test, and integration perspectives it is useful for components to operate similarly at room and cryogenic temperatures; however this is not a necessity. Some of the circuits presented here have been used successfully in the MUSTANG and in the GISMO camera to build a complete digital to analog multiplexer (which will be referred to as the Cryogenic Address Driver board). Many of the circuit elements described are of a more general nature rather than specific to the Cryogenic Address Driver board, and were studied as a part of a more comprehensive approach to addressing a larger set of cryogenic electronic needs.

  20. 33 Years of Continuous Solar Radio Flux Observations

    NASA Astrophysics Data System (ADS)

    Monstein, Christian

    2015-10-01

    In 1982, after development and testing of several analog receiver concepts, I started continuous solar radio flux observations at 230 MHz. My instruments for the observations were based on cheap commercial components out of consumer TV electronics. The main components included a TV-tuner (at that time analog), intermediate frequency (IF) amplifier and video-detector taken from used TV sets. The 5.5 MHz wide video signal was fed into an integrating circuit, in fact a low pass filter, followed by dc-offset circuit and dc-amplifier built with four ua741 and CA3140 operational amplifier integrated circuits. At that time the signal was recorded with a Heathkit stripchart recorder and ink pen; an example is shown in figure 1.

  1. Noise isolation system for high-speed circuits

    DOEpatents

    McNeilly, D.R.

    1983-12-29

    A noise isolation circuit is provided that consists of a dual function bypass which confines high-speed switching noise to the component or circuit which generates it and isolates the component or circuit from high-frequency noise transients which may be present on the ground and power supply busses. A local circuit ground is provided which is coupled to the system ground by sufficient impedance to force the dissipation of the noise signal in the local circuit or component generating the noise. The dual function bypass network couples high-frequency noise signals generated in the local component or circuit through a capacitor to the local ground while isolating the component or circuit from noise signals which may be present on the power supply busses or system ground. The network is an effective noise isolating system and is applicable to both high-speed analog and digital circuits.

  2. Noise isolation system for high-speed circuits

    DOEpatents

    McNeilly, David R.

    1986-01-01

    A noise isolation circuit is provided that consists of a dual function bypass which confines high-speed switching noise to the component or circuit which generates it and isolates the component or circuit from high-frequency noise transients which may be present on the ground and power supply busses. A local circuit ground is provided which is coupled to the system ground by sufficient impedance to force the dissipation of the noise signal in the local circuit or component generating the noise. The dual function bypass network couples high-frequency noise signals generated in the local component or circuit through a capacitor to the local ground while isolating the component or circuit from noise signals which may be present on the power supply busses or system ground. The network is an effective noise isolating system and is applicable to both high-speed analog and digital circuits.

  3. Evaluation of a 10 kV, 400 kA Si SGTO at High dI/dt

    DTIC Science & Technology

    2006-05-01

    inspection and high-potting of each component module prior to pulsing. The complete unit was then switched in a low inductance RLC circuit to test...during triggering. A ring down RLC circuit (Fig. 3) was designed with minimum inductance to test for peak dI/dt of anode-cathode flowing current. A...single 860 µF capacitor was charged to a chosen high voltage, then the power supply was disconnected and the switch was triggered to rapidly

  4. A Cost-Effective Energy-Recovering Sustain Driving Circuit for ac Plasma Display Panels

    NASA Astrophysics Data System (ADS)

    Lim, Jae Kwang; Tae, Heung-Sik; Choi, Byungcho; Kim, Seok Gi

    A new sustain driving circuit, featuring an energy-recovering function with simple structure and minimal component count, is proposed as a cost-effective solution for driving plasma display panels during the sustaining period. Compared with existing solutions, the proposed circuit reduces the number of semiconductor switches and reactive circuit components without compromising the circuit performance and gas-discharging characteristics. In addition, the proposed circuit utilizes the harness wire as an inductive circuit component, thereby further simplifying the circuit structure. The performance of the proposed circuit is confirmed with a 42-inch plasma display panel.

  5. NASA Tech Briefs, November 1997. Volume 21, No. 11

    NASA Technical Reports Server (NTRS)

    1997-01-01

    Topics covered include: Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Software; Mechanics; Machinery/Automation; Books and Reports..

  6. Re-using biological devices: a model-aided analysis of interconnected transcriptional cascades designed from the bottom-up.

    PubMed

    Pasotti, Lorenzo; Bellato, Massimo; Casanova, Michela; Zucca, Susanna; Cusella De Angelis, Maria Gabriella; Magni, Paolo

    2017-01-01

    The study of simplified, ad-hoc constructed model systems can help to elucidate if quantitatively characterized biological parts can be effectively re-used in composite circuits to yield predictable functions. Synthetic systems designed from the bottom-up can enable the building of complex interconnected devices via rational approach, supported by mathematical modelling. However, such process is affected by different, usually non-modelled, unpredictability sources, like cell burden. Here, we analyzed a set of synthetic transcriptional cascades in Escherichia coli . We aimed to test the predictive power of a simple Hill function activation/repression model (no-burden model, NBM) and of a recently proposed model, including Hill functions and the modulation of proteins expression by cell load (burden model, BM). To test the bottom-up approach, the circuit collection was divided into training and test sets, used to learn individual component functions and test the predicted output of interconnected circuits, respectively. Among the constructed configurations, two test set circuits showed unexpected logic behaviour. Both NBM and BM were able to predict the quantitative output of interconnected devices with expected behaviour, but only the BM was also able to predict the output of one circuit with unexpected behaviour. Moreover, considering training and test set data together, the BM captures circuits output with higher accuracy than the NBM, which is unable to capture the experimental output exhibited by some of the circuits even qualitatively. Finally, resource usage parameters, estimated via BM, guided the successful construction of new corrected variants of the two circuits showing unexpected behaviour. Superior descriptive and predictive capabilities were achieved considering resource limitation modelling, but further efforts are needed to improve the accuracy of models for biological engineering.

  7. NASA Tech Briefs, May 2000. Volume 24, No. 5

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics include: Sensors: Test and Measurement; Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Composites and Plastics; Materials; Computer Programs; Mechanics;

  8. NASA Tech Briefs, June 2000. Volume 24, No. 6

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics include: Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Test and Measurement; Physical Sciences; Materials; Computer Programs; Computers and Peripherals;

  9. Design, Fabrication and Integration of a NaK-Cooled Circuit

    NASA Technical Reports Server (NTRS)

    Garber, Anne; Godfroy, Thomas

    2006-01-01

    The Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system, which was originally designed for use with a eutectic mixture of sodium potassium (NaK), was redesigned to for use with lithium. Due to a shi$ in focus, it is once again being prepared for use with NaK. Changes made to the actively pumped, high temperature circuit include the replacement of the expansion reservoir, addition of remotely operated valves, and modification of the support table. Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a fill design) was selected for fabrication and test. This paper summarizes the integration and preparations for the fill of the pumped liquid metal NaK flow circuit.

  10. Design automation for integrated nonlinear logic circuits (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Van Vaerenbergh, Thomas; Pelc, Jason; Santori, Charles; Bose, Ranojoy; Kielpinski, Dave; Beausoleil, Raymond G.

    2016-05-01

    A key enabler of the IT revolution of the late 20th century was the development of electronic design automation (EDA) tools allowing engineers to manage the complexity of electronic circuits with transistor counts now reaching into the billions. Recently, we have been developing large-scale nonlinear photonic integrated logic circuits for next generation all-optical information processing. At this time a sufficiently powerful EDA-style software tool chain to design this type of complex circuits does not yet exist. Here we describe a hierarchical approach to automating the design and validation of photonic integrated circuits, which can scale to several orders of magnitude higher complexity than the state of the art. Most photonic integrated circuits developed today consist of a small number of components, and only limited hierarchy. For example, a simple photonic transceiver may contain on the order of 10 building-block components, consisting of grating couplers for photonic I/O, modulators, and signal splitters/combiners. Because this is relatively easy to lay out by hand (or simple script) existing photonic design tools have relatively little automation in comparison to electronics tools. But demonstrating all-optical logic will require significantly more complex photonic circuits containing up to 1,000 components, hence becoming infeasible to design manually. Our design framework is based off Python-based software from Luceda Photonics which provides an environment to describe components, simulate their behavior, and export design files (GDS) to foundries for fabrication. At a fundamental level, a photonic component is described as a parametric cell (PCell) similarly to electronics design. PCells are described by geometric characteristics of their layout. A critical part of the design framework is the implementation of PCells as Python objects. PCell objects can then use inheritance to simplify design, and hierarchical designs can be made by creating composite PCells (modules) which consist of primitive building-block PCells (components). To automatically produce layouts, we built on a construct provided by Luceda called a PlaceAndAutoRoute cell: we create a module component by supplying a list of child cells, and a list of the desired connections between the cells (e.g. the out0 port of a microring is connected to a grating coupler). This functionality allowed us to write algorithms to automatically lay out the components: for instance, by laying out the first component and walking through the list of connections to check to see if the next component is already placed or not. The placement and orientation of the new component is determined by minimizing the length of a connecting waveguide. Our photonic circuits also utilize electrical signals to tune the photonic elements (setting propagation phases or microring resonant frequencies via thermo-optical tuning): the algorithm also routes the contacts for the metal heaters to contact pads at the edge of the circuit being designed where it can be contacted by electrical probes. We are currently validating a test run fabricated over the summer, and will use detailed characterization results to prepare our final design cycle in which we aim to demonstrate complex operational logic circuits containing ~50-100 nonlinear resonators.

  11. 500 C Electronic Packaging and Dielectric Materials for High Temperature Applications

    NASA Technical Reports Server (NTRS)

    Chen, Liang-yu; Neudeck, Philip G.; Spry, David J.; Beheim, Glenn M.; Hunter, Gary W.

    2016-01-01

    High-temperature environment operable sensors and electronics are required for exploring the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and application of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high temperature electronics, and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by these high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed. High-temperature environment operable sensors and electronics are required for probing the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and eventual applications of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high electronics and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed.

  12. NASA Tech Briefs, July 1999. Volume 23, No. 7

    NASA Technical Reports Server (NTRS)

    1999-01-01

    Topics: Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Software; Mechanics; Machinery/Automation; Bio-Medical; Books and Reports; Semiconductors/ICs.

  13. Characterization of a piezoelectric MEMS actuator surface toward motion-enabled reconfigurable RF circuits

    NASA Astrophysics Data System (ADS)

    Tellers, M. C.; Pulskamp, J. S.; Bedair, S. S.; Rudy, R. Q.; Kierzewski, I. M.; Polcawich, R. G.; Bergbreiter, S. E.

    2018-03-01

    As an alternative to highly constrained hard-wired reconfigurable RF circuits, a motion-enabled reconfigurable circuit (MERC) offers freedom from transmission line losses and homogeneous materials selection. The creation of a successful MERC requires a precise mechanical mechanism for relocating components. In this work, a piezoelectric MEMS actuator array is modeled and experimentally characterized to assess its viability as a solution to the MERC concept. Actuation and design parameters are evaluated, and the repeatability of high quality on-axis motion at greater than 1 mm s-1 is demonstrated with little positional error. Finally, an initial proof-of-concept circuit reconfiguration has been demonstrated using off-the-shelf RF filter components. Although initial feasibility tests show filter performance degradation with an additional insertion loss of 0.3 dB per contact, out-of-band rejection degradation as high as 10 dB, and ripple performance reduction from 0.25 dB to 1.5 dB, MERC is proven here as an alternative to traditional approaches used in reconfigurable RF circuit applications.

  14. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Mayle, Scott; Gupta, Tanuj; Davis, Sam

    Monitoring of the intrinsic temperature and the thermal management is discussed for the carbon nanotube nano-circuits. The experimental results concerning fabricating and testing of a thermometer able to monitor the intrinsic temperature on nanoscale are reported. We also suggest a model which describes a bi-metal multilayer system able to filter the heat flow, based on separating the electron and phonon components one from another. The bi-metal multilayer structure minimizes the phonon component of the heat flow, while retaining the electronic part. The method allows one to improve the overall performance of the electronic nano-circuits due to minimizing the energy dissipation.

  15. Shock absorbing mount for electrical components

    NASA Technical Reports Server (NTRS)

    Dillon, R. F., Jr.; Mayne, R. C. (Inventor)

    1975-01-01

    A shock mount for installing electrical components on circuit boards is described. The shock absorber is made of viscoelastic material which interconnects the electrical components. With this system, shocks imposed on one component of the circuit are not transmitted to other components. A diagram of a typical circuit is provided.

  16. Stainless Steel NaK Circuit Integration and Fill Submission

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2006-01-01

    The Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system, which was originally designed to hold a eutectic mixture of sodium potassium (NaK), was redesigned to hold lithium; but due to a shift in focus, it is once again being prepared for use with NaK. Changes made to the actively pumped, high temperature loop include the replacement of the expansion reservoir, addition of remotely operated valves, and modification of the support table. Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This document summarizes the integration and fill of the pumped liquid metal NaK flow circuit.

  17. Electronic Components and Circuits for Extreme Temperature Environments

    NASA Technical Reports Server (NTRS)

    Patterson, Richard L.; Hammoud, Ahmad; Dickman, John E.; Gerber, Scott

    2003-01-01

    Planetary exploration missions and deep space probes require electrical power management and control systems that are capable of efficient and reliable operation in very low temperature environments. Presently, spacecraft operating in the cold environment of deep space carry a large number of radioisotope heating units in order to maintain the surrounding temperature of the on-board electronics at approximately 20 C. Electronics capable of operation at cryogenic temperatures will not only tolerate the hostile environment of deep space but also reduce system size and weight by eliminating or reducing the radioisotope heating units and their associate structures; thereby reducing system development as well as launch costs. In addition, power electronic circuits designed for operation at low temperatures are expected to result in more efficient systems than those at room temperature. This improvement results from better behavior and tolerance in the electrical and thermal properties of semiconductor and dielectric materials at low temperatures. The Low Temperature Electronics Program at the NASA Glenn Research Center focuses on research and development of electrical components, circuits, and systems suitable for applications in the aerospace environment and deep space exploration missions. Research is being conducted on devices and systems for reliable use down to cryogenic temperatures. Some of the commercial-off-the-shelf as well as developed components that are being characterized include switching devices, resistors, magnetics, and capacitors. Semiconductor devices and integrated circuits including digital-to-analog and analog-to-digital converters, DC/DC converters, operational amplifiers, and oscillators are also being investigated for potential use in low temperature applications. An overview of the NASA Glenn Research Center Low Temperature Electronic Program will be presented in this paper. A description of the low temperature test facilities along with selected data obtained through in-house component and circuit testing will also be discussed. Ongoing research activities that are being performed in collaboration with various organizations will also be presented.

  18. In-line task 57: Component evaluation. [of circuit breakers, panel switches, etc. for space shuttle

    NASA Technical Reports Server (NTRS)

    Boykin, J. C.

    1974-01-01

    Design analysis tests were performed on selected power switching components to determine the possible applicability of off-the-shelf hardware to space shuttles. Various characteristics were also evaluated in those devices to determine the most desirable properties for the space shuttle.

  19. A novel prediction method about single components of analog circuits based on complex field modeling.

    PubMed

    Zhou, Jingyu; Tian, Shulin; Yang, Chenglin

    2014-01-01

    Few researches pay attention to prediction about analog circuits. The few methods lack the correlation with circuit analysis during extracting and calculating features so that FI (fault indicator) calculation often lack rationality, thus affecting prognostic performance. To solve the above problem, this paper proposes a novel prediction method about single components of analog circuits based on complex field modeling. Aiming at the feature that faults of single components hold the largest number in analog circuits, the method starts with circuit structure, analyzes transfer function of circuits, and implements complex field modeling. Then, by an established parameter scanning model related to complex field, it analyzes the relationship between parameter variation and degeneration of single components in the model in order to obtain a more reasonable FI feature set via calculation. According to the obtained FI feature set, it establishes a novel model about degeneration trend of analog circuits' single components. At last, it uses particle filter (PF) to update parameters for the model and predicts remaining useful performance (RUP) of analog circuits' single components. Since calculation about the FI feature set is more reasonable, accuracy of prediction is improved to some extent. Finally, the foregoing conclusions are verified by experiments.

  20. NASA Tech Briefs, September 2000. Volume 24, No. 9

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics include: Sensors; Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery/Automation; Bio-Medical; semiconductors/ICs; Books and Reports.

  1. NASA Tech Briefs, December 1994. Volume 18, No. 12

    NASA Technical Reports Server (NTRS)

    1994-01-01

    Topics: Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery; Fabrication; Mathematics and Information Sciences; Life Sciences; Books and Reports

  2. NREL/NASA Internal Short-Circuit Instigator in Lithium Ion Cells; NREL (National Renewable Energy Laboratory)

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Long, Dirk; Ireland, John; Pesaran, Ahmad

    NREL has developed a device to test one of the most challenging failure mechanisms of lithium-ion (Li-ion) batteries -- a battery internal short circuit. Many members of the technical community believe that this type of failure is caused by a latent flaw that results in a short circuit between electrodes during use. As electric car manufacturers turn to Li-ion batteries for energy storage, solving the short circuit problem becomes more important. To date, no reliable and practical method exists to create on-demand internal shorts in Li-ion cells that produce a response that is relevant to the ones produced by fieldmore » failures. NREL and NASA have worked to establish an improved ISC cell-level test method that simulates an emergent internal short circuit, is capable of triggering the four types of cell internal shorts, and produces consistent and reproducible results. Internal short circuit device design is small, low-profile and implantable into Li-ion cells, preferably during assembly. The key component is an electrolyte-compatible phase change material (PCM). The ISC is triggered by heating the cell above PCM melting temperature (presently 40 degrees C – 60 degrees C). In laboratory testing, the activated device can handle currents in excess of 300 A to simulate hard shorts (< 2 mohms). Phase change from non-conducting to conducting has been 100% successful during trigger tests.« less

  3. Evaluation of an enhanced gravity-based fine-coal circuit for high-sulfur coal

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Mohanty, M.K.; Samal, A.R.; Palit, A.

    One of the main objectives of this study was to evaluate a fine-coal cleaning circuit using an enhanced gravity separator specifically for a high sulfur coal application. The evaluation not only included testing of individual unit operations used for fine-coal classification, cleaning and dewatering, but also included testing of the complete circuit simultaneously. At a scale of nearly 2 t/h, two alternative circuits were evaluated to clean a minus 0.6-mm coal stream utilizing a 150-mm-diameter classifying cyclone, a linear screen having a projected surface area of 0.5 m{sup 2}, an enhanced gravity separator having a bowl diameter of 250 mmmore » and a screen-bowl centrifuge having a bowl diameter of 500 mm. The cleaning and dewatering components of both circuits were the same; however, one circuit used a classifying cyclone whereas the other used a linear screen as the classification device. An industrial size coal spiral was used to clean the 2- x 0.6-mm coal size fraction for each circuit to estimate the performance of a complete fine-coal circuit cleaning a minus 2-mm particle size coal stream. The 'linear screen + enhanced gravity separator + screen-bowl circuit' provided superior sulfur and ash-cleaning performance to the alternative circuit that used a classifying cyclone in place of the linear screen. Based on these test data, it was estimated that the use of the recommended circuit to treat 50 t/h of minus 2-mm size coal having feed ash and sulfur contents of 33.9% and 3.28%, respectively, may produce nearly 28.3 t/h of clean coal with product ash and sulfur contents of 9.15% and 1.61 %, respectively.« less

  4. Testing of Diode-Clamping in an Inductive Pulsed Plasma Thruster Circuit

    NASA Technical Reports Server (NTRS)

    Toftul, Alexandra; Polzin, Kurt A.; Martin, Adam K.; Hudgins, Jerry L.

    2014-01-01

    Testing of a 5.5 kV silicon (Si) diode and 5.8 kV prototype silicon carbide (SiC) diode in an inductive pulsed plasma thruster (IPPT) circuit was performed to obtain a comparison of the resulting circuit recapture efficiency,eta(sub r), defined as the percentage of the initial charge energy remaining on the capacitor bank after the diode interrupts the current. The diode was placed in a pulsed circuit in series with a silicon controlled rectifier (SCR) switch, and the voltages across different components and current waveforms were collected over a range of capacitor charge voltages. Reverse recovery parameters, including turn-off time and peak reverse recovery current, were measured and capacitor voltage waveforms were used to determine the recapture efficiency for each case. The Si fast recovery diode in the circuit was shown to yield a recapture efficiency of up to 20% for the conditions tested, while the SiC diode further increased recapture efficiency to nearly 30%. The data presented show that fast recovery diodes operate on a timescale that permits them to clamp the discharge quickly after the first half cycle, supporting the idea that diode-clamping in IPPT circuit reduces energy dissipation that occurs after the first half cycle

  5. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Modeste Nguimdo, Romain, E-mail: Romain.Nguimdo@vub.ac.be; Tchitnga, Robert; Woafo, Paul

    We numerically investigate the possibility of using a coupling to increase the complexity in simplest chaotic two-component electronic circuits operating at high frequency. We subsequently show that complex behaviors generated in such coupled systems, together with the post-processing are suitable for generating bit-streams which pass all the NIST tests for randomness. The electronic circuit is built up by unidirectionally coupling three two-component (one active and one passive) oscillators in a ring configuration through resistances. It turns out that, with such a coupling, high chaotic signals can be obtained. By extracting points at fixed interval of 10 ns (corresponding to a bitmore » rate of 100 Mb/s) on such chaotic signals, each point being simultaneously converted in 16-bits (or 8-bits), we find that the binary sequence constructed by including the 10(or 2) least significant bits pass statistical tests of randomness, meaning that bit-streams with random properties can be achieved with an overall bit rate up to 10×100 Mb/s =1Gbit/s (or 2×100 Mb/s =200 Megabit/s). Moreover, by varying the bias voltages, we also investigate the parameter range for which more complex signals can be obtained. Besides being simple to implement, the two-component electronic circuit setup is very cheap as compared to optical and electro-optical systems.« less

  6. A Novel Prediction Method about Single Components of Analog Circuits Based on Complex Field Modeling

    PubMed Central

    Tian, Shulin; Yang, Chenglin

    2014-01-01

    Few researches pay attention to prediction about analog circuits. The few methods lack the correlation with circuit analysis during extracting and calculating features so that FI (fault indicator) calculation often lack rationality, thus affecting prognostic performance. To solve the above problem, this paper proposes a novel prediction method about single components of analog circuits based on complex field modeling. Aiming at the feature that faults of single components hold the largest number in analog circuits, the method starts with circuit structure, analyzes transfer function of circuits, and implements complex field modeling. Then, by an established parameter scanning model related to complex field, it analyzes the relationship between parameter variation and degeneration of single components in the model in order to obtain a more reasonable FI feature set via calculation. According to the obtained FI feature set, it establishes a novel model about degeneration trend of analog circuits' single components. At last, it uses particle filter (PF) to update parameters for the model and predicts remaining useful performance (RUP) of analog circuits' single components. Since calculation about the FI feature set is more reasonable, accuracy of prediction is improved to some extent. Finally, the foregoing conclusions are verified by experiments. PMID:25147853

  7. NASA Tech Briefs, February 1997. Volume 2, No. 2

    NASA Technical Reports Server (NTRS)

    1997-01-01

    Topics include: Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery/Automation; Manufacturing/Fabrication; Mathematics and Information Sciences; Life Sciences; Books and Reports

  8. NASA Tech Briefs, February 1994. Volume 18, No. 2

    NASA Technical Reports Server (NTRS)

    1994-01-01

    Topics covered include: Test and Measurement; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery; Fabrication Technology; Mathematics and Information Sciences; Life Sciences; Books and Reports

  9. Development and evaluation of endurance test system for ventricular assist devices.

    PubMed

    Sumikura, Hirohito; Homma, Akihiko; Ohnuma, Kentaro; Taenaka, Yoshiyuki; Takewa, Yoshiaki; Mukaibayashi, Hiroshi; Katano, Kazuo; Tatsumi, Eisuke

    2013-06-01

    We developed a novel endurance test system that can arbitrarily set various circulatory conditions and has durability and stability for long-term continuous evaluation of ventricular assist devices (VADs), and we evaluated its fundamental performance and prolonged durability and stability. The circulation circuit of the present endurance test system consisted of a pulsatile pump with a small closed chamber (SCC), a closed chamber, a reservoir and an electromagnetic proportional valve. Two duckbill valves were mounted in the inlet and outlet of the pulsatile pump. The features of the circulation circuit are as follows: (1) the components of the circulation circuit consist of optimized industrial devices, giving durability; (2) the pulsatile pump can change the heart rate and stroke length (SL), as well as its compliance using the SCC. Therefore, the endurance test system can quantitatively reproduce various circulatory conditions. The range of reproducible circulatory conditions in the endurance test circuit was examined in terms of fundamental performance. Additionally, continuous operation for 6 months was performed in order to evaluate the durability and stability. The circulation circuit was able to set up a wide range of pressure and total flow conditions using the SCC and adjusting the pulsatile pump SL. The long-term continuous operation test demonstrated that stable, continuous operation for 6 months was possible without leakage or industrial device failure. The newly developed endurance test system demonstrated a wide range of reproducible circulatory conditions, durability and stability, and is a promising approach for evaluating the basic characteristics of VADs.

  10. Three types of solid state remote power controllers

    NASA Technical Reports Server (NTRS)

    Baker, D. E.

    1975-01-01

    Three types of solid state Remote Power Controller (RPC) circuits for 120 Vdc spacecraft distribution systems have been developed and evaluated. Both current limiting and noncurrent limiting modes of overload protection were developed and were demonstrated to be feasible. A second generation of circuits was developed which offers comparable performance with substantially less cost and complexity. Electrical efficiency for both generations is 98.5 to 99%. This paper describes various aspects of the circuit design, trade-off studies, and experimental test results. Comparisons of design parameters, component requirements, and engineering model evaluations will emphasize the high efficiency and reliability of the designs.

  11. Stretchable polymer-based electronic device

    DOEpatents

    Maghribi, Mariam N [Livermore, CA; Krulevitch, Peter A [Pleasanton, CA; Davidson, James Courtney [Livermore, CA; Wilson, Thomas S [Castro Valley, CA; Hamilton, Julie K [Tracy, CA; Benett, William J [Livermore, CA; Tovar, Armando R [San Antonio, TX

    2008-02-26

    A stretchable electronic circuit or electronic device and a polymer-based process to produce a circuit or electronic device containing a stretchable conducting circuit. The stretchable electronic apparatus has a central longitudinal axis and the apparatus is stretchable in a longitudinal direction generally aligned with the central longitudinal axis. The apparatus comprises a stretchable polymer body and at least one circuit line operatively connected to the stretchable polymer body. The circuit line extends in the longitudinal direction and has a longitudinal component that extends in the longitudinal direction and has an offset component that is at an angle to the longitudinal direction. The longitudinal component and the offset component allow the apparatus to stretch in the longitudinal direction while maintaining the integrity of the circuit line.

  12. Monitoring Digital Closed-Loop Feedback Systems

    NASA Technical Reports Server (NTRS)

    Katz, Richard; Kleyner, Igor

    2011-01-01

    A technique of monitoring digital closed-loop feedback systems has been conceived. The basic idea is to obtain information on the performances of closed-loop feedback circuits in such systems to aid in the determination of the functionality and integrity of the circuits and of performance margins. The need for this technique arises as follows: Some modern digital systems include feedback circuits that enable other circuits to perform with precision and are tolerant of changes in environment and the device s parameters. For example, in a precision timing circuit, it is desirable to make the circuit insensitive to variability as a result of the manufacture of circuit components and to the effects of temperature, voltage, radiation, and aging. However, such a design can also result in masking the indications of damaged and/or deteriorating components. The present technique incorporates test circuitry and associated engineering-telemetry circuitry into an embedded system to monitor the closed-loop feedback circuits, using spare gates that are often available in field programmable gate arrays (FPGAs). This technique enables a test engineer to determine the amount of performance margin in the system, detect out of family circuit performance, and determine one or more trend(s) in the performance of the system. In one system to which the technique has been applied, an ultra-stable oscillator is used as a reference for internal adjustment of 12 time-to-digital converters (TDCs). The feedback circuit produces a pulse-width-modulated signal that is fed as a control input into an amplifier, which controls the circuit s operating voltage. If the circuit s gates are determined to be operating too slowly or rapidly when their timing is compared with that of the reference signal, then the pulse width increases or decreases, respectively, thereby commanding the amplifier to increase or reduce, respectively, its output level, and "adjust" the speed of the circuits. The nominal frequency of the TDC s pulse width modulated outputs is approximately 40 kHz. In this system, the technique is implemented by means of a monitoring circuit that includes a 20-MHz sampling circuit and a 24-bit accumulator with a gate time of 10 ms. The monitoring circuit measures the duty cycle of each of the 12 TDCs at a repetition rate of 28 Hz. The accumulator content is reset to all zeroes at the beginning of each measurement period and is then incremented or decremented based of the value of the state of the pulse width modulated signal. Positive or negative values in the accumulator correspond to duty cycles greater or less, respectively, than 50 percent.

  13. Power converter using near-load output capacitance, direct inductor contact, and/or remote current sense

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Coteus, Paul W.; Ferencz, Andrew; Hall, Shawn A.

    An apparatus includes a first circuit board including first components including a load, and a second circuit board including second components including switching power devices and an output inductor. Ground and output voltage contacts between the circuit boards are made through soldered or connectorized interfaces. Certain components on the first circuit board and certain components, including the output inductor, on the second circuit board act as a DC-DC voltage converter for the load. An output capacitance for the conversion is on the first circuit board with no board-to-board interface between the output capacitance and the load. The inductance of themore » board-to-board interface functions as part of the output inductor's inductance and not as a parasitic inductance. Sense components for sensing current through the output inductor are located on the first circuit board. Parasitic inductance of the board-to-board interface has less effect on a sense signal provided to a controller.« less

  14. NASA Tech Briefs, February 2000. Volume 24, No. 2

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics covered include: Test and Measurement; Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Bio-Medical; Mathematics and Information Sciences; Computers and Peripherals.

  15. NASA Tech Briefs, April 2000. Volume 24, No. 4

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics covered include: Imaging/Video/Display Technology; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Bio-Medical; Test and Measurement; Mathematics and Information Sciences; Books and Reports.

  16. Instrumentation Cables Test Plan

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Muna, Alice Baca; LaFleur, Chris Bensdotter

    A fire at a nuclear power plant (NPP) has the potential to damage structures, systems, and components important to safety, if not promptly detected and suppressed. At Browns Ferry Nuclear Power Plant on March 22, 1975, a fire in the reactor building damaged electrical power and control systems. Damage to instrumentation cables impeded the function of both normal and standby reactor coolant systems, and degraded the operators’ plant monitoring capability. This event resulted in additional NRC involvement with utilities to ensure that NPPs are properly protected from fire as intended by the NRC principle design criteria (i.e., general design criteriamore » 3, Fire Protection). Current guidance and methods for both deterministic and performance based approaches typically make conservative (bounding) assumptions regarding the fire-induced failure modes of instrumentation cables and those failure modes effects on component and system response. Numerous fire testing programs have been conducted in the past to evaluate the failure modes and effects of electrical cables exposed to severe thermal conditions. However, that testing has primarily focused on control circuits with only a limited number of tests performed on instrumentation circuits. In 2001, the Nuclear Energy Institute (NEI) and the Electric Power Research Institute (EPRI) conducted a series of cable fire tests designed to address specific aspects of the cable failure and circuit fault issues of concern1. The NRC was invited to observe and participate in that program. The NRC sponsored Sandia National Laboratories to support this participation, whom among other things, added a 4-20 mA instrumentation circuit and instrumentation cabling to six of the tests. Although limited, one insight drawn from those instrumentation circuits tests was that the failure characteristics appeared to depend on the cable insulation material. The results showed that for thermoset insulated cables, the instrument reading tended to drift and fluctuate, while the thermoplastic insulated cables, the instrument reading fell off-scale rapidly. From an operational point of view, the latter failure characteristics would likely be identified as a failure from the effects of fire, while the former may result in inaccurate readings.« less

  17. Electronic Components Subsystems and Equipment: a Compilation

    NASA Technical Reports Server (NTRS)

    1975-01-01

    Developments in electronic components, subsystems, and equipment are summarized. Topics discussed include integrated circuit components and techniques, circuit components and techniques, and cables and connectors.

  18. Fabric-based active electrode design and fabrication for health monitoring clothing.

    PubMed

    Merritt, Carey R; Nagle, H Troy; Grant, Edward

    2009-03-01

    In this paper, two versions of fabric-based active electrodes are presented to provide a wearable solution for ECG monitoring clothing. The first version of active electrode involved direct attachment of surface-mountable components to a textile screen-printed circuit using polymer thick film techniques. The second version involved attaching a much smaller, thinner, and less obtrusive interposer containing the active electrode circuitry to a simplified textile circuit. These designs explored techniques for electronic textile interconnection, chip attachment to textiles, and packaging of circuits on textiles for durability. The results from ECG tests indicate that the performance of each active electrode is comparable to commercial Ag/AgCl electrodes. The interposer-based active electrodes survived a five-cycle washing test while maintaining good signal integrity.

  19. Perceived importance of components of asynchronous music during circuit training.

    PubMed

    Crust, Lee

    2008-12-01

    This study examined regular exercisers' perceptions of specific components of music during circuit training. Twenty-four men (38.8 years, s = 11.8 years) and 31 women (32.4 years, s = 9.6 years) completed two questionnaires immediately after a circuit training class. Participants rated the importance of 13 components of music (rhythm, melody, etc.) in relation to exercise enjoyment, and each completed the "Affect Intensity Measure" (Larsen, 1984, Dissertation Abstracts International, 5, 2297B. (University microfilms No. 84-22112)) to measure emotional reactivity. Independent t-tests were used to evaluate gender differences in perceptions of musical importance. Pearson correlations were computed to evaluate the relationships between affect intensity, age and importance of musical components. Consistent with previous research and theoretical predictions, rhythm response components (rhythm, tempo, beat) were rated as most important. Women rated the importance of melody significantly higher than did men, whereas men gave more importance to music associated with sport. Affect intensity was found to be positively and significantly related to the perceived importance of melody, lyrical content, musical style, personal associations and emotional content. Results suggest that exercise leaders need to be sensitive to personal factors when choosing music to accompany exercise. Qualitative research that focuses on the personal meaning of music is encouraged.

  20. 40 CFR 86.1806-05 - On-board diagnostics for vehicles less than or equal to 14,000 pounds GVWR.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... once per applicable certification test cycle as defined in paragraphs (a) and (d) of Appendix I of this...-based test procedures), excluding those test procedures defined as “Supplemental” test procedures in... infeasibility. Malfunctions are defined as a failure of the system or component to meet the electrical circuit...

  1. 40 CFR 86.1806-05 - On-board diagnostics for vehicles less than or equal to 14,000 pounds GVWR.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... once per applicable certification test cycle as defined in paragraphs (a) and (d) of Appendix I of this...-based test procedures), excluding those test procedures defined as “Supplemental” test procedures in... infeasibility. Malfunctions are defined as a failure of the system or component to meet the electrical circuit...

  2. Rapid evolution of analog circuits configured on a field programmable transistor array

    NASA Technical Reports Server (NTRS)

    Stoica, A.; Ferguson, M. I.; Zebulum, R. S.; Keymeulen, D.; Duong, V.; Daud, T.

    2002-01-01

    The purpose of this paper is to illustrate evolution of analog circuits on a stand-alone board-level evolvable system (SABLES). SABLES is part of an effort to achieve integrated evolvable systems. SABLES provides autonomous, fast (tens to hundreds of seconds), on-chip circuit evolution involving about 100,000 circuit evaluations. Its main components are a JPL Field Programmable Transistor Array (FPTA) chip used as transistor-level reconfigurable hardware, and a TI DSP that implements the evolutionary algorithm controlling the FPTA reconfiguration. The paper details an example of evolution on SABLES and points out to certain transient and memory effects that affect the stability of solutions obtained reusing the same piece of hardware for rapid testing of individuals during evolution.

  3. Hybrid stretchable circuits on silicone substrate

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Robinson, A., E-mail: adam.1.robinson@nokia.com; Aziz, A., E-mail: a.aziz1@lancaster.ac.uk; Liu, Q.

    When rigid and stretchable components are integrated onto a single elastic carrier substrate, large strain heterogeneities appear in the vicinity of the deformable-non-deformable interfaces. In this paper, we report on a generic approach to manufacture hybrid stretchable circuits where commercial electronic components can be mounted on a stretchable circuit board. Similar to printed circuit board development, the components are electrically bonded on the elastic substrate and interconnected with stretchable electrical traces. The substrate—a silicone matrix carrying concentric rigid disks—ensures both the circuit elasticity and the mechanical integrity of the most fragile materials.

  4. NASA Tech Briefs, November 2000. Volume 24, No. 11

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics covered include: Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Test and Measurement; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery/Automation; Manufacturing/Fabrication; Mathematics and Information Sciences; Data Acquisition.

  5. Experimental Determination of the Low-Energy Spectral Component of Cobalt-60 Sources

    DTIC Science & Technology

    1986-04-01

    dependence of the TLD detectors and the dose enhancement due to the lack of electronic equilibrium have been included in the figure. A series of...energy spectrum of cobalt,60 ir- radiators is essential to the proper interpretation of dosimetry and device test data in radiation response testing...of electronic devices and circuits. It is shown that the relative magnitude of the low-energy spec- tral component of cobalt󈨀 gamma radiation can be

  6. Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 2: Tests with the closed circuit

    NASA Technical Reports Server (NTRS)

    Barna, P. Stephen

    1991-01-01

    This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period June - August 1991. Throughout the testing the tunnel was operated in the 'closed circuit mode,' that is when the airflow was set up by an axial flow fan, which was located inside the tunnel circuit and was directly driven by a motor. The tests were first performed with the closed test section and were subsequently repeated with the open test section, the latter operating with the nozzle-diffuser at its optimum setting. On this subject, reference is made to the report (1) issued January 1991, under contract 17-GFY900125, which summarizes the result obtained with the tunnel operating in the 'open circuit mode.' The tests confirmed the viability of the tunnel design, and the flow distributions in most of the tunnel components were considered acceptable. There were found, however, some locations where the flow distribution requires improvement. This applies to the flow upstream of the fan where the flow was found skewed, thus affecting the flow downstream. As a result of this, the flow appeared separated at the end of the large diffuser at the outer side. All tests were performed at NASA LaRC.

  7. Directly writing resistor, inductor and capacitor to composite functional circuits: a super-simple way for alternative electronics.

    PubMed

    Gao, Yunxia; Li, Haiyan; Liu, Jing

    2013-01-01

    The current strategies for making electronic devices are generally time, water, material and energy consuming. Here, the direct writing of composite functional circuits through comprehensive use of GaIn10-based liquid metal inks and matching material is proposed and investigated, which is a rather easy going and cost effective electronics fabrication way compared with the conventional approaches. Owing to its excellent adhesion and electrical properties, the liquid metal ink was demonstrated as a generalist in directly making various basic electronic components such as planar resistor, inductor and capacitor or their combination and thus composing circuits with expected electrical functions. For a precise control of the geometric sizes of the writing, a mask with a designed pattern was employed and demonstrated. Mechanisms for justifying the chemical components of the inks and the magnitudes of the target electronic elements so as to compose various practical circuits were disclosed. Fundamental tests on the electrical components including capacitor and inductor directly written on paper with working time up to 48 h and elevated temperature demonstrated their good stability and potential widespread adaptability especially when used in some high frequency circuits. As the first proof-of-concept experiment, a typical functional oscillating circuit including an integrated chip of 74HC04 with a supply voltage of 5 V, a capacitor of 10 nF and two resistors of 5 kΩ and 1 kΩ respectively was directly composed on paper through integrating specific electrical elements together, which presented an oscillation frequency of 8.8 kHz. The present method significantly extends the roles of the metal ink in recent works serving as only a single electrical conductor or interconnecting wires. It opens the way for directly writing out complex functional circuits or devices on different substrates. Such circuit composition strategy has generalized purpose and can be extended to more areas, even daily pervasive electronics.

  8. Directly Writing Resistor, Inductor and Capacitor to Composite Functional Circuits: A Super-Simple Way for Alternative Electronics

    PubMed Central

    Gao, Yunxia; Li, Haiyan; Liu, Jing

    2013-01-01

    Background The current strategies for making electronic devices are generally time, water, material and energy consuming. Here, the direct writing of composite functional circuits through comprehensive use of GaIn10-based liquid metal inks and matching material is proposed and investigated, which is a rather easy going and cost effective electronics fabrication way compared with the conventional approaches. Methods Owing to its excellent adhesion and electrical properties, the liquid metal ink was demonstrated as a generalist in directly making various basic electronic components such as planar resistor, inductor and capacitor or their combination and thus composing circuits with expected electrical functions. For a precise control of the geometric sizes of the writing, a mask with a designed pattern was employed and demonstrated. Mechanisms for justifying the chemical components of the inks and the magnitudes of the target electronic elements so as to compose various practical circuits were disclosed. Results Fundamental tests on the electrical components including capacitor and inductor directly written on paper with working time up to 48 h and elevated temperature demonstrated their good stability and potential widespread adaptability especially when used in some high frequency circuits. As the first proof-of-concept experiment, a typical functional oscillating circuit including an integrated chip of 74HC04 with a supply voltage of 5 V, a capacitor of 10 nF and two resistors of 5 kΩ and 1 kΩ respectively was directly composed on paper through integrating specific electrical elements together, which presented an oscillation frequency of 8.8 kHz. Conclusions The present method significantly extends the roles of the metal ink in recent works serving as only a single electrical conductor or interconnecting wires. It opens the way for directly writing out complex functional circuits or devices on different substrates. Such circuit composition strategy has generalized purpose and can be extended to more areas, even daily pervasive electronics. PMID:23936349

  9. GPS synchronized power system phase angle measurements

    NASA Astrophysics Data System (ADS)

    Wilson, Robert E.; Sterlina, Patrick S.

    1994-09-01

    This paper discusses the use of Global Positioning System (GPS) synchronized equipment for the measurement and analysis of key power system quantities. Two GPS synchronized phasor measurement units (PMU) were installed before testing. It was indicated that PMUs recorded the dynamic response of the power system phase angles when the northern California power grid was excited by the artificial short circuits. Power system planning engineers perform detailed computer generated simulations of the dynamic response of the power system to naturally occurring short circuits. The computer simulations use models of transmission lines, transformers, circuit breakers, and other high voltage components. This work will compare computer simulations of the same event with field measurement.

  10. Associative Pattern Recognition In Analog VLSI Circuits

    NASA Technical Reports Server (NTRS)

    Tawel, Raoul

    1995-01-01

    Winner-take-all circuit selects best-match stored pattern. Prototype cascadable very-large-scale integrated (VLSI) circuit chips built and tested to demonstrate concept of electronic associative pattern recognition. Based on low-power, sub-threshold analog complementary oxide/semiconductor (CMOS) VLSI circuitry, each chip can store 128 sets (vectors) of 16 analog values (vector components), vectors representing known patterns as diverse as spectra, histograms, graphs, or brightnesses of pixels in images. Chips exploit parallel nature of vector quantization architecture to implement highly parallel processing in relatively simple computational cells. Through collective action, cells classify input pattern in fraction of microsecond while consuming power of few microwatts.

  11. NASA Tech Briefs, August 2000. Volume 24, No. 8

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics include: Simulation/Virtual Reality; Test and Measurement; Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery/Automation; Manufacturing/Fabrication; Mathematics and Information Sciences; Medical Design.

  12. JEN-1 Reactor Control System; SISTEMA DE CONTROL DEL REACTOR JEN-1

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Cantillo, M.F.; Nuno, C.M.; Andreu, J.L.M.

    1963-01-01

    ABS>The JEN-1 3Mw power swimming pool reactor electrical control circuits are described. Start-up, power generation in the core, and shutdown are controlled by the reactor control system. This control system guarantees in each moment the safety conditions during reactor operation. Each circuit was represented by a scheme, complemented with a description of its function, components, and operation theory. Components described include: scram circuit; fission counter control circuit; servo control circuit; control circuit of safety sheets; control circuits of primary, secondary, and clean-up pump motors and tower fan motor; primary valve motor circuit; center cubicle alarm circuit; and process alarm circuit.more » (auth)« less

  13. 30 CFR 18.68 - Tests for intrinsic safety.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... requirements may be added at any time if features of construction or use or both indicate them to be necessary.... They shall be designed to withstand a test voltage of 1,500 volts. (4) Intrinsically safe circuits shall be so designed that after failure of a single component, and subsequent failures resulting from...

  14. 30 CFR 18.68 - Tests for intrinsic safety.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... requirements may be added at any time if features of construction or use or both indicate them to be necessary.... They shall be designed to withstand a test voltage of 1,500 volts. (4) Intrinsically safe circuits shall be so designed that after failure of a single component, and subsequent failures resulting from...

  15. 30 CFR 18.68 - Tests for intrinsic safety.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... requirements may be added at any time if features of construction or use or both indicate them to be necessary.... They shall be designed to withstand a test voltage of 1,500 volts. (4) Intrinsically safe circuits shall be so designed that after failure of a single component, and subsequent failures resulting from...

  16. 30 CFR 18.68 - Tests for intrinsic safety.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... requirements may be added at any time if features of construction or use or both indicate them to be necessary.... They shall be designed to withstand a test voltage of 1,500 volts. (4) Intrinsically safe circuits shall be so designed that after failure of a single component, and subsequent failures resulting from...

  17. Investigation of discrete component chip mounting technology for hybrid microelectronic circuits

    NASA Technical Reports Server (NTRS)

    Caruso, S. V.; Honeycutt, J. O.

    1975-01-01

    The use of polymer adhesives for high reliability microcircuit applications is a radical deviation from past practices in electronic packaging. Bonding studies were performed using two gold-filled conductive adhesives, 10/90 tin/lead solder and Indalloy no. 7 solder. Various types of discrete components were mounted on ceramic substrates using both thick-film and thin-film metallization. Electrical and mechanical testing were performed on the samples before and after environmental exposure to MIL-STD-883 screening tests.

  18. Design and Characterization of DNA Strand-Displacement Circuits in Serum-Supplemented Cell Medium.

    PubMed

    Fern, Joshua; Schulman, Rebecca

    2017-09-15

    The functional stability and lifetimes of synthetic molecular circuits in biological environments are important for long-term, stable sensors or controllers of cell or tissue behavior. DNA-based molecular circuits, in particular DNA strand-displacement circuits, provide simple and effective biocompatible control mechanisms and sensors, but are vulnerable to digestion by nucleases present in living tissues and serum-supplemented cell culture. The stability of double-stranded and single-stranded DNA circuit components in serum-supplemented cell medium and the corresponding effect of nuclease-mediated degradation on circuit performance were characterized to determine the major routes of degradation and DNA strand-displacement circuit failure. Simple circuit design choices, such as the use of 5' toeholds within the DNA complexes used as reactants in the strand-displacement reactions and the termination of single-stranded components with DNA hairpin domains at the 3' termini, significantly increase the functional lifetime of the circuit components in the presence of nucleases. Simulations of multireaction circuits, guided by the experimentally measured operation of single-reaction circuits, enable predictive realization of multilayer and competitive-reaction circuit behavior. Together, these results provide a basic route to increased DNA circuit stability in cell culture environments.

  19. Design and Characterization of DNA Strand-Displacement Circuits in Serum-Supplemented Cell Medium

    DOE PAGES

    Fern, Joshua; Schulman, Rebecca

    2017-05-30

    The functional stability and lifetimes of synthetic molecular circuits in biological environments are important for long-term, stable sensors or controllers of cell or tissue behavior. DNA-based molecular circuits, particularly DNA strand-displacement circuits, provide simple and effective biocompatible control mechanisms and sensors, but are vulnerable to digestion by nucleases present in living tissues and serum-supplemented cell culture. The stability of double-stranded and single-stranded DNA circuit components in serum-supplemented cell medium and the corresponding effect of nuclease-mediated degradation on circuit performance were characterized to determine the major routes of degradation and DNA strand-displacement circuit failure. Simple circuit design choices, such as themore » use of 5' toeholds within the DNA complexes used as reactants in the strand-displacement reactions and the termination of single-stranded components with DNA hairpin domains at the 3' termini, significantly increase the functional lifetime of the circuit components in the presence of nucleases. Furthermore, simulations of multireaction circuits, guided by the experimentally measured operation of single-reaction circuits, enable predictive realization of multilayer and competitive-reaction circuit behavior. Altogether, these results provide a basic route to increased DNA circuit stability in cell culture environments.« less

  20. Design and Characterization of DNA Strand-Displacement Circuits in Serum-Supplemented Cell Medium

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Fern, Joshua; Schulman, Rebecca

    The functional stability and lifetimes of synthetic molecular circuits in biological environments are important for long-term, stable sensors or controllers of cell or tissue behavior. DNA-based molecular circuits, particularly DNA strand-displacement circuits, provide simple and effective biocompatible control mechanisms and sensors, but are vulnerable to digestion by nucleases present in living tissues and serum-supplemented cell culture. The stability of double-stranded and single-stranded DNA circuit components in serum-supplemented cell medium and the corresponding effect of nuclease-mediated degradation on circuit performance were characterized to determine the major routes of degradation and DNA strand-displacement circuit failure. Simple circuit design choices, such as themore » use of 5' toeholds within the DNA complexes used as reactants in the strand-displacement reactions and the termination of single-stranded components with DNA hairpin domains at the 3' termini, significantly increase the functional lifetime of the circuit components in the presence of nucleases. Furthermore, simulations of multireaction circuits, guided by the experimentally measured operation of single-reaction circuits, enable predictive realization of multilayer and competitive-reaction circuit behavior. Altogether, these results provide a basic route to increased DNA circuit stability in cell culture environments.« less

  1. Apparatus and method for defect testing of integrated circuits

    DOEpatents

    Cole, Jr., Edward I.; Soden, Jerry M.

    2000-01-01

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V.sub.DD, to an IC under test and measures a transient voltage component, V.sub.DDT, signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V.sub.DDT signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V.sub.DDT signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  2. Creating single-copy genetic circuits

    PubMed Central

    Lee, Jeong Wook; Gyorgy, Andras; Cameron, D. Ewen; Pyenson, Nora; Choi, Kyeong Rok; Way, Jeffrey C.; Silver, Pamela A.; Del Vecchio, Domitilla; Collins, James J.

    2017-01-01

    SUMMARY Synthetic biology is increasingly used to develop sophisticated living devices for basic and applied research. Many of these genetic devices are engineered using multi-copy plasmids, but as the field progresses from proof-of-principle demonstrations to practical applications, it is important to develop single-copy synthetic modules that minimize consumption of cellular resources and can be stably maintained as genomic integrants. Here we use empirical design, mathematical modeling and iterative construction and testing to build single-copy, bistable toggle switches with improved performance and reduced metabolic load that can be stably integrated into the host genome. Deterministic and stochastic models led us to focus on basal transcription to optimize circuit performance and helped to explain the resulting circuit robustness across a large range of component expression levels. The design parameters developed here provide important guidance for future efforts to convert functional multi-copy gene circuits into optimized single-copy circuits for practical, real-world use. PMID:27425413

  3. Design of rapid prototype of UAV line-of-sight stabilized control system

    NASA Astrophysics Data System (ADS)

    Huang, Gang; Zhao, Liting; Li, Yinlong; Yu, Fei; Lin, Zhe

    2018-01-01

    The line-of-sight (LOS) stable platform is the most important technology of UAV (unmanned aerial vehicle), which can reduce the effect to imaging quality from vibration and maneuvering of the aircraft. According to the requirement of LOS stability system (inertial and optical-mechanical combined method) and UAV's structure, a rapid prototype is designed using based on industrial computer using Peripheral Component Interconnect (PCI) and Windows RTX to exchange information. The paper shows the control structure, and circuit system including the inertial stability control circuit with gyro and voice coil motor driven circuit, the optical-mechanical stability control circuit with fast-steering-mirror (FSM) driven circuit and image-deviation-obtained system, outer frame rotary follower, and information-exchange system on PC. Test results show the stability accuracy reaches 5μrad, and prove the effectiveness of the combined line-of-sight stabilization control system, and the real-time rapid prototype runs stable.

  4. Battery tester

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Poljak, M.D.

    1985-08-12

    This abstract discloses an improved battery tester for determining the acceptability of a Lithium Sulfur Dioxide (LiSO/sub 2/) storage battery at a given temperature and with one or more cells therein. The tester is generally made up of a first-comparison circuit having a series of series-interconnected components, namely a comparator, first and second flip-flops, and an AND gate. A first resistor is parallel connected to the first-comparison circuit. A second comparison circuit is also parallel connected to the first-comparison circuit and is generally made up of series-interconnected components, namely a second resistor, a capacitor, a buffer, and a second-comparator. Amore » first switch is connected to the first resistor and a second switch is parallel connected to the second-comparison circuit between the capacitor and the buffer. A logic control arrangement controls the operation of both switches, both comparators, and both flip-flops for testing a battery as to its start-up voltage and performance voltage characteristics all in a relatively short time period. In another embodiment of the tester, it is provided with an analog-to-digital converter, a memory, and a sensor arrangement for enhancing the versatility and reliability of the tester in determining the acceptability of a LiSO/sub 2/ battery.« less

  5. NASA Tech Briefs, July 2000. Volume 24, No. 7

    NASA Technical Reports Server (NTRS)

    2000-01-01

    Topics covered include: Data Acquisition; Computer-Aided Design and Engineering; Electronic Components and Circuits; Electronic Systems; Test and Measurement; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery/Automation; Manufacturing/Fabrication; Mathematics and Information Sciences; Life Sciences; Books and Reports.

  6. Digitally Programmable Analogue Circuits for Sensor Conditioning Systems

    PubMed Central

    Zatorre, Guillermo; Medrano, Nicolás; Sanz, María Teresa; Aldea, Concepción; Calvo, Belén; Celma, Santiago

    2009-01-01

    This work presents two current-mode integrated circuits designed for sensor signal preprocessing in embedded systems. The proposed circuits have been designed to provide good signal transfer and fulfill their function, while minimizing the load effects due to building complex conditioning architectures. The processing architecture based on the proposed building blocks can be reconfigured through digital programmability. Thus, sensor useful range can be expanded, changes in the sensor operation can be compensated for and furthermore, undesirable effects such as device mismatching and undesired physical magnitudes sensor sensibilities are reduced. The circuits were integrated using a 0.35 μm standard CMOS process. Experimental measurements, load effects and a study of two different tuning strategies are presented. From these results, system performance is tested in an application which entails extending the linear range of a magneto-resistive sensor. Circuit area, average power consumption and programmability features allow these circuits to be included in embedded sensing systems as a part of the analogue conditioning components. PMID:22412331

  7. A 25-kW Series-Resonant Power Converter

    NASA Technical Reports Server (NTRS)

    Frye, R. J.; Robson, R. R.

    1986-01-01

    Prototype exhibited efficiency of 93.9 percent. 25-kW resonant dc/dc power converter designed, developed, fabricated, and tested, using Westinghouse D7ST transistors as high-power switches. D7ST transistor characterized for use as switch in series-resonant converters, and refined base-drive circuit developed. Technical base includes advanced switching magnetic, and filter components, mathematical circuit models, control philosophies, and switch-drive strategies. Power-system benefits such as lower losses when used for high-voltage distribution, and reduced magnetics and filter mass realized.

  8. Protection of the electronic components of measuring equipment from the X-ray radiation

    NASA Astrophysics Data System (ADS)

    Perez Vasquez, N. O.; Kostrin, D. K.; Uhov, A. A.

    2018-02-01

    In this work the effect of X-ray radiation on the operation of integrated circuits of the measurement equipment is discussed. The results of the calculations of a shielding system, allowing using integrated circuits with a high degree of integration in the vicinity of the X-ray source, are shown. The results of the verification of two measurement devices that was used for more than five years in the facility for training and testing of X-ray tubes are presented.

  9. Device serves as hinge and electrical connector for circuit boards

    NASA Technical Reports Server (NTRS)

    Bethel, P. G.; Harris, G. G.

    1966-01-01

    Hinge makes both sides of electrical circuit boards readily accessible for component checkout and servicing. The hinge permits mounting of two circuit boards and incorporates connectors to maintain continuous electrical contact between the components on both boards.

  10. Fixture aids soldering of electronic components on circuit board

    NASA Technical Reports Server (NTRS)

    Ross, M. H.

    1966-01-01

    Spring clamp fixture holds small electronic components in a desired position while they are being soldered on a circuit board. The spring clamp is clipped on the edge of the circuit board and an adjustable spring-steel boom holds components against the board. The felt pad at the end of the boom is replaced with different attachments for other holding tasks.

  11. Plasmonic integrated circuits comprising metal waveguides, multiplexer/demultiplexer, detectors, and logic circuits on a silicon substrate

    NASA Astrophysics Data System (ADS)

    Fukuda, M.; Ota, M.; Sumimura, A.; Okahisa, S.; Ito, M.; Ishii, Y.; Ishiyama, T.

    2017-05-01

    A plasmonic integrated circuit configuration comprising plasmonic and electronic components is presented and the feasibility for high-speed signal processing applications is discussed. In integrated circuits, plasmonic signals transmit data at high transfer rates with light velocity. Plasmonic and electronic components such as wavelength-divisionmultiplexing (WDM) networks comprising metal wires, plasmonic multiplexers/demultiplexers, and crossing metal wires are connected via plasmonic waveguides on the nanometer or micrometer scales. To merge plasmonic and electronic components, several types of plasmonic components were developed. To ensure that the plasmonic components could be easily fabricated and monolithically integrated onto a silicon substrate using silicon complementary metal-oxide-semiconductor (CMOS)-compatible processes, the components were fabricated on a Si substrate and made from silicon, silicon oxides, and metal; no other materials were used in the fabrication. The plasmonic components operated in the 1300- and 1550-nm-wavelength bands, which are typically employed in optical fiber communication systems. The plasmonic logic circuits were formed by patterning a silicon oxide film on a metal film, and the operation as a half adder was confirmed. The computed plasmonic signals can propagate through the plasmonic WDM networks and be connected to electronic integrated circuits at high data-transfer rates.

  12. An Analog Computer for Electronic Engineering Education

    ERIC Educational Resources Information Center

    Fitch, A. L.; Iu, H. H. C.; Lu, D. D. C.

    2011-01-01

    This paper describes a compact analog computer and proposes its use in electronic engineering teaching laboratories to develop student understanding of applications in analog electronics, electronic components, engineering mathematics, control engineering, safe laboratory and workshop practices, circuit construction, testing, and maintenance. The…

  13. Localized radio frequency communication using asynchronous transfer mode protocol

    DOEpatents

    Witzke, Edward L [Edgewood, NM; Robertson, Perry J [Albuquerque, NM; Pierson, Lyndon G [Albuquerque, NM

    2007-08-14

    A localized wireless communication system for communication between a plurality of circuit boards, and between electronic components on the circuit boards. Transceivers are located on each circuit board and electronic component. The transceivers communicate with one another over spread spectrum radio frequencies. An asynchronous transfer mode protocol controls communication flow with asynchronous transfer mode switches located on the circuit boards.

  14. Pratt and Whitney Overview and Advanced Health Management Program

    NASA Technical Reports Server (NTRS)

    Inabinett, Calvin

    2008-01-01

    Hardware Development Activity: Design and Test Custom Multi-layer Circuit Boards for use in the Fault Emulation Unit; Logic design performed using VHDL; Layout power system for lab hardware; Work lab issues with software developers and software testers; Interface with Engine Systems personnel with performance of Engine hardware components; Perform off nominal testing with new engine hardware.

  15. 40 CFR 86.1806-05 - Onboard diagnostics.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... certification test cycle as defined in paragraphs (a) and (d) of Appendix I of this part, or similar trip as... procedures defined as “Supplemental” test procedures in § 86.004-2 and codified in §§ 86.158, 86.159, and 86... infeasibility. Malfunctions are defined as a failure of the system or component to meet the electrical circuit...

  16. Testing methods and techniques: Testing electrical and electronic devices: A compilation

    NASA Technical Reports Server (NTRS)

    1972-01-01

    The methods, techniques, and devices used in testing various electrical and electronic apparatus are presented. The items described range from semiconductor package leak detectors to automatic circuit analyzer and antenna simulators for system checkout. In many cases the approaches can result in considerable cost savings and improved quality control. The testing of various electronic components, assemblies, and systems; the testing of various electrical devices; and the testing of cables and connectors are explained.

  17. Area-efficient physically unclonable function circuit architecture

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Gurrieri, Thomas; Hamlet, Jason; Bauer, Todd

    Generating a physically a physically unclonable function ("PUF") circuit value includes comparing each of first identification components in a first bank to each of second identification components in a second bank. A given first identification component in the first bank is not compared to another first identification component in the first bank and a given second identification component in the second bank is not compared to another second identification component in the second bank. A digital bit value is generated for each comparison made while comparing each of the first identification components to each of the second identification components. Amore » PUF circuit value is generated from the digital bit values from each comparison made.« less

  18. Integrated Advanced Microwave Sounding Unit-A (AMSU-A). Performance Verification Report: AMSU-A1 Antenna Drive Subsystem, PN 1331720-2, S/N 106

    NASA Technical Reports Server (NTRS)

    Luu, D.

    1999-01-01

    This is the Performance Verification Report, AMSU-A1 Antenna Drive Subsystem, P/N 1331720-2, S/N 106, for the Integrated Advanced Microwave Sounding Unit-A (AMSU-A). The antenna drive subsystem of the METSAT AMSU-A1, S/N 106, P/N 1331720-2, completed acceptance testing per A-ES Test Procedure AE-26002/lD. The test included: Scan Motion and Jitter, Pulse Load Bus Peak Current and Rise Time, Resolver Reading and Position Error, Gain/ Phase Margin, and Operational Gain Margin. The drive motors and electronic circuitry were also tested at the component level. The drive motor test includes: Starting Torque Test, Motor Commutation Test, Resolver Operation/ No-Load Speed Test, and Random Vibration. The electronic circuitry was tested at the Circuit Card Assembly (CCA) level of production; each test exercised all circuit functions. The transistor assembly was tested during the W3 cable assembly (1356941-1) test.

  19. Computer-Aided Design of Low-Noise Microwave Circuits

    NASA Astrophysics Data System (ADS)

    Wedge, Scott William

    1991-02-01

    Devoid of most natural and manmade noise, microwave frequencies have detection sensitivities limited by internally generated receiver noise. Low-noise amplifiers are therefore critical components in radio astronomical antennas, communications links, radar systems, and even home satellite dishes. A general technique to accurately predict the noise performance of microwave circuits has been lacking. Current noise analysis methods have been limited to specific circuit topologies or neglect correlation, a strong effect in microwave devices. Presented here are generalized methods, developed for computer-aided design implementation, for the analysis of linear noisy microwave circuits comprised of arbitrarily interconnected components. Included are descriptions of efficient algorithms for the simultaneous analysis of noisy and deterministic circuit parameters based on a wave variable approach. The methods are therefore particularly suited to microwave and millimeter-wave circuits. Noise contributions from lossy passive components and active components with electronic noise are considered. Also presented is a new technique for the measurement of device noise characteristics that offers several advantages over current measurement methods.

  20. Three-Function Logic Gate Controlled by Analog Voltage

    NASA Technical Reports Server (NTRS)

    Zebulum, Ricardo; Stoica, Adrian

    2006-01-01

    The figure is a schematic diagram of a complementary metal oxide/semiconductor (CMOS) electronic circuit that performs one of three different logic functions, depending on the level of an externally applied control voltage, V(sub sel). Specifically, the circuit acts as A NAND gate at V(sub sel) = 0.0 V, A wire (the output equals one of the inputs) at V(sub sel) = 1.0 V, or An AND gate at V(sub sel) = -1.8 V. [The nominal power-supply potential (VDD) and logic "1" potential of this circuit is 1.8 V.] Like other multifunctional circuits described in several prior NASA Tech Briefs articles, this circuit was synthesized following an automated evolutionary approach that is so named because it is modeled partly after the repetitive trial-and-error process of biological evolution. An evolved circuit can be tested by computational simulation and/or tested in real hardware, and the results of the test can provide guidance for refining the design through further iteration. The evolutionary synthesis of electronic circuits can now be implemented by means of a software package Genetic Algorithms for Circuit Synthesis (GACS) that was developed specifically for this purpose. GACS was used to synthesize the present trifunctional circuit. As in the cases of other multifunctional circuits described in several prior NASA Tech Briefs articles, the multiple functionality of this circuit, the use of a single control voltage to select the function, and the automated evolutionary approach to synthesis all contribute synergistically to a combination of features that are potentially advantageous for the further development of robust, multiple-function logic circuits, including, especially, field-programmable gate arrays (FPGAs). These advantages include the following: This circuit contains only 9 transistors about half the number of transistors that would be needed to obtain equivalent NAND/wire/AND functionality by use of components from a standard digital design library. If multifunctional gates like this circuit were used in the place of the configurable logic blocks of present commercial FPGAs, it would be possible to change the functions of the resulting digital systems within shorter times. For example, by changing a single control voltage, one could change the function of thousands of FPGA cells within nanoseconds. In contrast, typically, the reconfiguration in a conventional FPGA by use of bits downloaded from look-up tables via a digital bus takes microseconds.

  1. Measurement of luminescence decays: High performance at low cost

    NASA Astrophysics Data System (ADS)

    Sulkes, Mark; Sulkes, Zoe

    2011-11-01

    The availability of inexpensive ultra bright LEDs spanning the visible and near-ultraviolet combined with the availability of inexpensive electronics equipment makes it possible to construct a high performance luminescence lifetime apparatus (˜5 ns instrumental response or better) at low cost. A central need for time domain measurement systems is the ability to obtain short (˜1 ns or less) excitation light pulses from the LEDs. It is possible to build the necessary LED driver using a simple avalanche transistor circuit. We describe first a circuit to test for small signal NPN transistors that can avalanche. We then describe a final optimized avalanche mode circuit that we developed on a prototyping board by measuring driven light pulse duration as a function of the circuit on the board and passive component values. We demonstrate that the combination of the LED pulser and a 1P28 photomultiplier tube used in decay waveform acquisition has a time response that allows for detection and lifetime determination of luminescence decays down to ˜5 ns. The time response and data quality afforded with the same components in time-correlated single photon counting are even better. For time-correlated single photon counting an even simpler NAND-gate based LED driver circuit is also applicable. We also demonstrate the possible utility of a simple frequency domain method for luminescence lifetime determinations.

  2. A system for measuring the pulse height distribution of ultrafast photomultipliers

    NASA Technical Reports Server (NTRS)

    Abshire, J. B.

    1977-01-01

    A system for measuring the pulse height distribution of gigahertz bandwidth photomultipliers was developed. This system uses a sampling oscilloscope as a sample-hold circuit and has a bandwidth of 12 gigahertz. Test results are given for a static crossed-filed photomultiplier tested with a demonstration system. Calculations on system amplitude resolution capabilities are included for currently available system components.

  3. Protecting quantum information in superconducting circuits

    NASA Astrophysics Data System (ADS)

    Devoret, Michel

    Can we prolong the coherence of a two-state manifold in a complex quantum system beyond the coherence of its longest-lived component? This question is the starting point in the construction of a scalable quantum computer. It translates in the search for processes that operate as some sort of Maxwell's demon and reliably correct the errors resulting from the coupling between qubits and their environment. The presentation will review recent experiments that test the dynamical protection by Josephson circuits of a logical qubit memory based on superpositions of particular coherent states of a superconducting resonator.

  4. Printed Circuit Board Quality Assurance

    NASA Technical Reports Server (NTRS)

    Sood, Bhanu

    2016-01-01

    PCB Assurance Summary: PCB assurance actives are informed by risk in context of the Project. Lessons are being applied across Projects for continuous improvements. Newer component technologies, smaller/high pitch devices: tighter and more demanding PCB designs: Identifying new research areas. New materials, designs, structures and test methods.

  5. NASA Tech Briefs, November 1998. Volume 22, No. 11

    NASA Technical Reports Server (NTRS)

    1998-01-01

    Topics include: special coverage sections on test and measurement and sections on electronic components and circuits, electronic systems, software, materials, mechanics, machinery/automation, physical sciences, information sciences, book and reports, and special sections of Electronics Tech Briefs amd Rapid Product Development Tech Briefs.

  6. Extended behavioural device modelling and circuit simulation with Qucs-S

    NASA Astrophysics Data System (ADS)

    Brinson, M. E.; Kuznetsov, V.

    2018-03-01

    Current trends in circuit simulation suggest a growing interest in open source software that allows access to more than one simulation engine while simultaneously supporting schematic drawing tools, behavioural Verilog-A and XSPICE component modelling, and output data post-processing. This article introduces a number of new features recently implemented in the 'Quite universal circuit simulator - SPICE variant' (Qucs-S), including structure and fundamental schematic capture algorithms, at the same time highlighting their use in behavioural semiconductor device modelling. Particular importance is placed on the interaction between Qucs-S schematics, equation-defined devices, SPICE B behavioural sources and hardware description language (HDL) scripts. The multi-simulator version of Qucs is a freely available tool that offers extended modelling and simulation features compared to those provided by legacy circuit simulators. The performance of a number of Qucs-S modelling extensions are demonstrated with a GaN HEMT compact device model and data obtained from tests using the Qucs-S/Ngspice/Xyce ©/SPICE OPUS multi-engine circuit simulator.

  7. Beyond excitation/inhibition imbalance in multidimensional models of neural circuit changes in brain disorders.

    PubMed

    O'Donnell, Cian; Gonçalves, J Tiago; Portera-Cailliau, Carlos; Sejnowski, Terrence J

    2017-10-11

    A leading theory holds that neurodevelopmental brain disorders arise from imbalances in excitatory and inhibitory (E/I) brain circuitry. However, it is unclear whether this one-dimensional model is rich enough to capture the multiple neural circuit alterations underlying brain disorders. Here, we combined computational simulations with analysis of in vivo two-photon Ca 2+ imaging data from somatosensory cortex of Fmr1 knock-out (KO) mice, a model of Fragile-X Syndrome, to test the E/I imbalance theory. We found that: (1) The E/I imbalance model cannot account for joint alterations in the observed neural firing rates and correlations; (2) Neural circuit function is vastly more sensitive to changes in some cellular components over others; (3) The direction of circuit alterations in Fmr1 KO mice changes across development. These findings suggest that the basic E/I imbalance model should be updated to higher dimensional models that can better capture the multidimensional computational functions of neural circuits.

  8. Beyond excitation/inhibition imbalance in multidimensional models of neural circuit changes in brain disorders

    PubMed Central

    Gonçalves, J Tiago; Portera-Cailliau, Carlos

    2017-01-01

    A leading theory holds that neurodevelopmental brain disorders arise from imbalances in excitatory and inhibitory (E/I) brain circuitry. However, it is unclear whether this one-dimensional model is rich enough to capture the multiple neural circuit alterations underlying brain disorders. Here, we combined computational simulations with analysis of in vivo two-photon Ca2+ imaging data from somatosensory cortex of Fmr1 knock-out (KO) mice, a model of Fragile-X Syndrome, to test the E/I imbalance theory. We found that: (1) The E/I imbalance model cannot account for joint alterations in the observed neural firing rates and correlations; (2) Neural circuit function is vastly more sensitive to changes in some cellular components over others; (3) The direction of circuit alterations in Fmr1 KO mice changes across development. These findings suggest that the basic E/I imbalance model should be updated to higher dimensional models that can better capture the multidimensional computational functions of neural circuits. PMID:29019321

  9. Serpentine and corduroy circuits to enhance the stretchability of a stretchable electronic device

    DOEpatents

    Maghribi, Mariam N [Livermore, CA; Krulevitch, Peter A [Pleasanton, CA; Wilson, Thomas S [Castro Valley, CA; Hamilton, Julie K. , Park; Christina, [Cambridge, MA

    2007-09-04

    A stretchable electronic apparatus and method of producing the apparatus. The apparatus has a central longitudinal axis and the apparatus is stretchable in a longitudinal direction generally aligned with the central longitudinal axis. The apparatus comprises a stretchable polymer body, and at least one circuit line operatively connected to the stretchable polymer body, the at least one circuit line extending in the longitudinal direction and having a longitudinal component that extends in the longitudinal direction and having an offset component that is at an angle to the longitudinal direction, the longitudinal component and the offset component allowing the apparatus to stretch in the longitudinal direction while maintaining the integrity of the at least one circuit line.

  10. Serpentine and corduroy circuits to enhance the stretchablity of a stretchable electronic device

    DOEpatents

    Maghribi, Mariam N [Livermore, CA; Krulevitch, Peter A [Pleasanton, CA; Wilson, Thomas S [Castro Valley, CA; Hamilton, Julie K [Tracy, CA; Park, Christina [Cambridge, MA

    2011-01-18

    A stretchable electronic apparatus and method of producing the apparatus. The apparatus has a central longitudinal axis and the apparatus is stretchable in a longitudinal direction generally aligned with the central longitudinal axis. The apparatus comprises a stretchable polymer body, and at least one circuit line operatively connected to the stretchable polymer body, the at least one circuit line extending in the longitudinal direction and having a longitudinal component that extends in the longitudinal direction and having an offset component that is at an angle to the longitudinal direction, the longitudinal component and the offset component allowing the apparatus to stretch in the longitudinal direction while maintaining the integrity of the at least one circuit line.

  11. Automated visual inspection system based on HAVNET architecture

    NASA Astrophysics Data System (ADS)

    Burkett, K.; Ozbayoglu, Murat A.; Dagli, Cihan H.

    1994-10-01

    In this study, the HAusdorff-Voronoi NETwork (HAVNET) developed at the UMR Smart Engineering Systems Lab is tested in the recognition of mounted circuit components commonly used in printed circuit board assembly systems. The automated visual inspection system used consists of a CCD camera, a neural network based image processing software and a data acquisition card connected to a PC. The experiments are run in the Smart Engineering Systems Lab in the Engineering Management Dept. of the University of Missouri-Rolla. The performance analysis shows that the vision system is capable of recognizing different components under uncontrolled lighting conditions without being effected by rotation or scale differences. The results obtained are promising and the system can be used in real manufacturing environments. Currently the system is being customized for a specific manufacturing application.

  12. Electronic circuits and systems: A compilation. [including integrated circuits, logic circuits, varactor diode circuits, low pass filters, and optical equipment circuits

    NASA Technical Reports Server (NTRS)

    1975-01-01

    Technological information is presented electronic circuits and systems which have potential utility outside the aerospace community. Topics discussed include circuit components such as filters, converters, and integrators, circuits designed for use with specific equipment or systems, and circuits designed primarily for use with optical equipment or displays.

  13. Development of a standardized control module for dc-to-dc converters

    NASA Technical Reports Server (NTRS)

    Yu, Y.; Iwens, R. I.; Lee, F. C.; Inouye, L. Y.

    1977-01-01

    The electrical performance of a power processor depends on the quality of its control system. Most of the existing control circuits suffer one or more of the following imperfections that tend to restrict their respective utility: (1) inability to perform different modes of duty cycle control; (2) lack of immunity to output filter parameter changes, and (3) lack of capability to provide power component stress limiting on an instantaneous basis. The three lagging aspects of existing control circuits have been used to define the major objectives of the current Standardized Control Module (SCM) Program. Detailed information on the SCM functional block diagram, its universality, and performance features, circuit description, test results, and modeling and analysis efforts are presented.

  14. Circuit-based versus full-wave modelling of active microwave circuits

    NASA Astrophysics Data System (ADS)

    Bukvić, Branko; Ilić, Andjelija Ž.; Ilić, Milan M.

    2018-03-01

    Modern full-wave computational tools enable rigorous simulations of linear parts of complex microwave circuits within minutes, taking into account all physical electromagnetic (EM) phenomena. Non-linear components and other discrete elements of the hybrid microwave circuit are then easily added within the circuit simulator. This combined full-wave and circuit-based analysis is a must in the final stages of the circuit design, although initial designs and optimisations are still faster and more comfortably done completely in the circuit-based environment, which offers real-time solutions at the expense of accuracy. However, due to insufficient information and general lack of specific case studies, practitioners still struggle when choosing an appropriate analysis method, or a component model, because different choices lead to different solutions, often with uncertain accuracy and unexplained discrepancies arising between the simulations and measurements. We here design a reconfigurable power amplifier, as a case study, using both circuit-based solver and a full-wave EM solver. We compare numerical simulations with measurements on the manufactured prototypes, discussing the obtained differences, pointing out the importance of measured parameters de-embedding, appropriate modelling of discrete components and giving specific recipes for good modelling practices.

  15. Vibration analysis of printed circuit boards: Effect of boundary condition

    NASA Astrophysics Data System (ADS)

    Prashanth, M. D.

    2018-04-01

    A spacecraft consists of a number of electronic packages to meet the functional requirements. An electronic package is generally an assembly of printed circuit boards placed in a mechanical housing. A number of electronic components are mounted on the printed circuit board (PCB). A spacecraft experiences various types of loads during its launch such as vibration, acoustic and shock loads. Prediction of response for printed circuit boards due to vibration loads is important for mechanical design and reliability of electronic packages. The modeling and analysis of printed circuit boards is required for accurate prediction of response due to vibration loads. The response of PCB is highly dependent on the mounting configuration of PCB. In addition, anti-vibration mounts or stiffeners are used to reduce the PCB response. Vibration analysis of printed circuit boards is carried out using finite element method. The objective of this paper is to determine the dynamic characteristics of a printed circuit board. Modeling and analysis of PCB shall be carried out to study the effect of boundary conditions on the vibration response. The modeling of stiffeners or ribs shall also be considered in detail. The analysis results shall be validated using vibration tests of PCB.

  16. Assessment of thermal loads in the CERN SPS crab cavities cryomodule1

    NASA Astrophysics Data System (ADS)

    Carra, F.; Apeland, J.; Calaga, R.; Capatina, O.; Capelli, T.; Verdú-Andrés, S.; Zanoni, C.

    2017-07-01

    As a part of the HL-LHC upgrade, a cryomodule is designed to host two crab cavities for a first test with protons in the SPS machine. The evaluation of the cryomodule heat loads is essential to dimension the cryogenic infrastructure of the system. The current design features two cryogenic circuits. The first circuit adopts superfluid helium at 2 K to maintain the cavities in the superconducting state. The second circuit, based on helium gas at a temperature between 50 K and 70 K, is connected to the thermal screen, also serving as heat intercept for all the interfaces between the cold mass and the external environment. An overview of the heat loads to both circuits, and the combined numerical and analytical estimations, is presented. The heat load of each element is detailed for the static and dynamic scenarios, with considerations on the design choices for the thermal optimization of the most critical components.

  17. Development of single cell lithium ion battery model using Scilab/Xcos

    NASA Astrophysics Data System (ADS)

    Arianto, Sigit; Yunaningsih, Rietje Y.; Astuti, Edi Tri; Hafiz, Samsul

    2016-02-01

    In this research, a lithium battery model, as a component in a simulation environment, was developed and implemented using Scicos/Xcos graphical language programming. Scicos used in this research was actually Xcos that is a variant of Scicos which is embedded in Scilab. The equivalent circuit model used in modeling the battery was Double Polarization (DP) model. DP model consists of one open circuit voltage (VOC), one internal resistance (Ri), and two parallel RC circuits. The parameters of the battery were extracted using Hybrid Power Pulse Characterization (HPPC) testing. In this experiment, the Double Polarization (DP) electrical circuit model was used to describe the lithium battery dynamic behavior. The results of simulation of the model were validated with the experimental results. Using simple error analysis, it was found out that the biggest error was 0.275 Volt. It was occurred mostly at the low end of the state of charge (SOC).

  18. Design and Development of Multi-Purpose CCD Camera System with Thermoelectric Cooling: Hardware

    NASA Astrophysics Data System (ADS)

    Kang, Y.-W.; Byun, Y. I.; Rhee, J. H.; Oh, S. H.; Kim, D. K.

    2007-12-01

    We designed and developed a multi-purpose CCD camera system for three kinds of CCDs; KAF-0401E(768×512), KAF-1602E(1536×1024), KAF-3200E(2184×1472) made by KODAK Co.. The system supports fast USB port as well as parallel port for data I/O and control signal. The packing is based on two stage circuit boards for size reduction and contains built-in filter wheel. Basic hardware components include clock pattern circuit, A/D conversion circuit, CCD data flow control circuit, and CCD temperature control unit. The CCD temperature can be controlled with accuracy of approximately 0.4° C in the max. range of temperature, Δ 33° C. This CCD camera system has with readout noise 6 e^{-}, and system gain 5 e^{-}/ADU. A total of 10 CCD camera systems were produced and our tests show that all of them show passable performance.

  19. Toxicity of electronic waste leachates to Daphnia magna: screening and toxicity identification evaluation of different products, components, and materials.

    PubMed

    Lithner, Delilah; Halling, Maja; Dave, Göran

    2012-05-01

    Electronic waste has become one of the fastest growing waste problems in the world. It contains both toxic metals and toxic organics. The aim of this study was to (1) investigate to what extent toxicants can leach from different electronic products, components, and materials into water and (2) identify which group of toxicants (metals or hydrophobic organics) that is causing toxicity. Components from five discarded electronic products (cell phone, computer, phone modem, keyboard, and computer mouse) were leached in deionised water for 3 days at 23°C in concentrations of 25 g/l for metal components, 50 g/l for mixed-material components, and 100 g/l for plastic components. The water phase was tested for acute toxicity to Daphnia magna. Eighteen of 68 leachates showed toxicity (with immobility of D. magna ≥ 50% after 48 h) and came from metal or mixed-material components. The 8 most toxic leachates, with 48 h EC(50)s ranging from 0.4 to 20 g/l, came from 2 circuit sheets (key board), integrated drive electronics (IDE) cable clips (computer), metal studs (computer), a circuit board (computer mouse), a cord (phone modem), mixed parts (cell phone), and a circuit board (key board). All 5 electronic products were represented among them. Toxicity identification evaluations (with C18 and CM resins filtrations and ethylenediaminetetraacetic acid addition) indicated that metals caused the toxicity in the majority of the most toxic leachates. Overall, this study has shown that electronic waste can leach toxic compounds also during short-term leaching with pure water.

  20. 77 FR 2957 - Application for Manufacturing Authority, Liberty Pumps, Inc. (Submersible and Water Pumps...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-01-20

    ..., mechanical seals, electric motors, transformers, capacitors, switches, electronic components, integrated circuits, process controllers, printed circuit assemblies, electrical components, and measuring instruments...

  1. Characteristics of Radio-Frequency Circuits Utilizing Ferroelectric Capacitors

    NASA Technical Reports Server (NTRS)

    Eskridge, Michael; Gui, Xiao; MacLeod, Todd; Ho, Fat D.

    2011-01-01

    Ferroelectric capacitors, most commonly used in memory circuits and variable components, were studied in simple analog radio-frequency circuits such as the RLC resonator and Colpitts oscillator. The goal was to characterize the RF circuits in terms of frequency of oscillation, gain, etc, using ferroelectric capacitors. Frequencies of oscillation of both circuits were measured and studied a more accurate resonant frequency can be obtained using the ferroelectric capacitors. Many experiments were conducted and data collected. A model to simulate the experimental results will be developed. Discrepancies in gain and frequency in these RF circuits when conventional capacitors are replaced with ferroelectric ones were studied. These results will enable circuit designers to anticipate the effects of using ferroelectric components in their radio- frequency applications.

  2. Verifying Digital Components of Physical Systems: Experimental Evaluation of Test Quality

    NASA Astrophysics Data System (ADS)

    Laputenko, A. V.; López, J. E.; Yevtushenko, N. V.

    2018-03-01

    This paper continues the study of high quality test derivation for verifying digital components which are used in various physical systems; those are sensors, data transfer components, etc. We have used logic circuits b01-b010 of the package of ITC'99 benchmarks (Second Release) for experimental evaluation which as stated before, describe digital components of physical systems designed for various applications. Test sequences are derived for detecting the most known faults of the reference logic circuit using three different approaches to test derivation. Three widely used fault types such as stuck-at-faults, bridges, and faults which slightly modify the behavior of one gate are considered as possible faults of the reference behavior. The most interesting test sequences are short test sequences that can provide appropriate guarantees after testing, and thus, we experimentally study various approaches to the derivation of the so-called complete test suites which detect all fault types. In the first series of experiments, we compare two approaches for deriving complete test suites. In the first approach, a shortest test sequence is derived for testing each fault. In the second approach, a test sequence is pseudo-randomly generated by the use of an appropriate software for logic synthesis and verification (ABC system in our study) and thus, can be longer. However, after deleting sequences detecting the same set of faults, a test suite returned by the second approach is shorter. The latter underlines the fact that in many cases it is useless to spend `time and efforts' for deriving a shortest distinguishing sequence; it is better to use the test minimization afterwards. The performed experiments also show that the use of only randomly generated test sequences is not very efficient since such sequences do not detect all the faults of any type. After reaching the fault coverage around 70%, saturation is observed, and the fault coverage cannot be increased anymore. For deriving high quality short test suites, the approach that is the combination of randomly generated sequences together with sequences which are aimed to detect faults not detected by random tests, allows to reach the good fault coverage using shortest test sequences.

  3. Nuclear code case development of printed-circuit heat exchangers with thermal and mechanical performance testing

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Aakre, Shaun R.; Jentz, Ian W.; Anderson, Mark H.

    The U.S. Department of Energy has agreed to fund a three-year integrated research project to close technical gaps involved with compact heat exchangers to be used in nuclear applications. This paper introduces the goals of the project, the research institutions, and industrial partners working in collaboration to develop a draft Boiler and Pressure Vessel Code Case for this technology. Heat exchanger testing, as well as non-destructive and destructive evaluation, will be performed by researchers across the country to understand the performance of compact heat exchangers. Testing will be performed using coolants and conditions proposed for Gen IV Reactor designs. Preliminarymore » observations of the mechanical failure mechanisms of the heat exchangers using destructive and non-destructive methods is presented. Unit-cell finite element models assembled to help predict the mechanical behavior of these high-temperature components are discussed as well. Performance testing methodology is laid out in this paper along with preliminary modeling results, an introduction to x-ray and neutron inspection techniques, and results from a recent pressurization test of a printed-circuit heat exchanger. The operational and quality assurance knowledge gained from these models and validation tests will be useful to developers of supercritical CO 2 systems, which commonly employ printed-circuit heat exchangers.« less

  4. Evidence for a Specific Integrative Mechanism for Episodic Memory Mediated by AMPA/kainate Receptors in a Circuit Involving Medial Prefrontal Cortex and Hippocampal CA3 Region.

    PubMed

    de Souza Silva, Maria A; Huston, Joseph P; Wang, An-Li; Petri, David; Chao, Owen Yuan-Hsin

    2016-07-01

    We asked whether episodic-like memory requires neural mechanisms independent of those that mediate its component memories for "what," "when," and "where," and if neuronal connectivity between the medial prefrontal cortex (mPFC) and the hippocampus (HPC) CA3 subregion is essential for episodic-like memory. Unilateral lesion of the mPFC was combined with unilateral lesion of the CA3 in the ipsi- or contralateral hemispheres in rats. Episodic-like memory was tested using a task, which assesses the integration of memories for "what, where, and when" concomitantly. Tests for novel object recognition (what), object place (where), and temporal order memory (when) were also applied. Bilateral disconnection of the mPFC-CA3 circuit by N-methyl-d-aspartate (NMDA) lesions disrupted episodic-like memory, but left the component memories for object, place, and temporal order, per se, intact. Furthermore, unilateral NMDA lesion of the CA3 plus injection of (6-cyano-7-nitroquinoxaline-2,3-dione) (CNQX) (AMPA/kainate receptor antagonist), but not AP-5 (NMDA receptor antagonist), into the contralateral mPFC also disrupted episodic-like memory, indicating the mPFC AMPA/kainate receptors as critical for this circuit. These results argue for a selective neural system that specifically subserves episodic memory, as it is not critically involved in the control of its component memories for object, place, and time. © The Author 2015. Published by Oxford University Press. All rights reserved. For Permissions, please e-mail: journals.permissions@oup.com.

  5. A current-excited triple-time-voltage oversampling method for bio-impedance model for cost-efficient circuit system.

    PubMed

    Yan Hong; Yong Wang; Wang Ling Goh; Yuan Gao; Lei Yao

    2015-08-01

    This paper presents a mathematic method and a cost-efficient circuit to measure the value of each component of the bio-impedance model at electrode-electrolyte interface. The proposed current excited triple-time-voltage oversampling (TTVO) method deduces the component values by solving triple simultaneous electric equation (TSEE) at different time nodes during a current excitation, which are the voltage functions of time. The proposed triple simultaneous electric equations (TSEEs) allows random selections of the time nodes, hence numerous solutions can be obtained during a single current excitation. Following that, the oversampling approach is engaged by averaging all solutions of multiple TSEEs acquired after a single current excitation, which increases the practical measurement accuracy through the improvement of the signal-to-noise ratio (SNR). In addition, a print circuit board (PCB) that consists a switched current exciter and an analog-to-digital converter (ADC) is designed for signal acquisition. This presents a great cost reduction when compared against other instrument-based measurement data reported [1]. Through testing, the measured values of this work is proven to be in superb agreements on the true component values of the electrode-electrolyte interface model. This work is most suited and also useful for biological and biomedical applications, to perform tasks such as stimulations, recordings, impedance characterizations, etc.

  6. Main Power Distribution Unit for the Jupiter Icy Moons Orbiter (JIMO)

    NASA Technical Reports Server (NTRS)

    Papa, Melissa R.

    2004-01-01

    Around the year 2011, the Jupiter Icy Moons Orbiter (JIMO) will be launched and on its way to orbit three of Jupiter s planet-sized moons. The mission goals for the JIMO project revolve heavily around gathering scientific data concerning ingredients we, as humans, consider essential: water, energy and necessary chemical elements. The JIM0 is an ambitious mission which will implore propulsion from an ION thruster powered by a nuclear fission reactor. Glenn Research Center is responsible for the development of the dynamic power conversion, power management and distribution, heat rejection and ION thrusters. The first test phase for the JIM0 program concerns the High Power AC Power Management and Distribution (PMAD) Test Bed. The goal of this testing is to support electrical performance verification of the power systems. The test bed will incorporate a 2kW Brayton Rotating Unit (BRU) to simulate the nuclear reactor as well as two ION thrusters. The first module of the PMAD Test Bed to be designed is the Main Power Distribution Unit (MPDU) which relays the power input to the various propulsion systems and scientific instruments. The MPDU involves circuitry design as well as mechanical design to determine the placement of the components. The MPDU consists of fourteen relays of four different variations used to convert the input power into the appropriate power output. The three phase system uses 400 Vo1ts(sub L-L) rms at 1000 Hertz. The power is relayed through the circuit and distributed to the scientific instruments, the ION thrusters and other controlled systems. The mechanical design requires the components to be positioned for easy electrical wiring as well as allowing adequate room for the main buss bars, individual circuit boards connected to each component and power supplies. To accomplish creating a suitable design, AutoCAD was used as a drafting tool. By showing a visual layout of the components, it is easy to see where there is extra room or where the components may interfere with one another. By working with the electrical engineer who is designing the circuit, the specific design requirements for the MPDU were determined and used as guidelines. Space is limited due to the size of the mounting plate therefore each component must be strategically placed. Since the MPDU is being designed to fit into a simulated model of the spacecraft systems on the JIMO, components must be positioned where they are easily accessible to be wired to the other onboard systems. Mechanical and electrical requirements provided equally important limits which are combined to produce the best possible design of the MPDU.

  7. Deep Charging Evaluation of Satellite Power and Communication System Components

    NASA Technical Reports Server (NTRS)

    Schneider, T. A.; Vaughn, J. A.; Chu, B.; Wong, F.; Gardiner, G.; Wright, K. H.; Phillips, B.

    2016-01-01

    A set of deep charging tests has been carried out by NASA's Marshall Space Flight Center on subscale flight-like samples developed by Space Systems/Loral, LLC. The samples, which included solar array wire coupons, a photovoltaic cell coupon, and a coaxial microwave transmission cable, were placed in passive and active (powered) circuit configurations and exposed to electron radiation. The energy of the electron radiation was chosen to deeply penetrate insulating (dielectric) materials on each sample. Each circuit configuration was monitored to determine if potentially damaging electrostatic discharge events (arcs) were developed on the coupon as a result of deep charging. The motivation for the test, along with charging levels, experimental setup, sample details, and results will be discussed.

  8. Logarithmic current measurement circuit with improved accuracy and temperature stability and associated method

    DOEpatents

    Ericson, M. Nance; Rochelle, James M.

    1994-01-01

    A logarithmic current measurement circuit for operating upon an input electric signal utilizes a quad, dielectrically isolated, well-matched, monolithic bipolar transistor array. One group of circuit components within the circuit cooperate with two transistors of the array to convert the input signal logarithmically to provide a first output signal which is temperature-dependant, and another group of circuit components cooperate with the other two transistors of the array to provide a second output signal which is temperature-dependant. A divider ratios the first and second output signals to provide a resultant output signal which is independent of temperature. The method of the invention includes the operating steps performed by the measurement circuit.

  9. Electronic inverter assembly

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Singh, Brij N.; Schmit, Christopher J.

    A first driver portion comprises a set of first components mounted on or associated with a first circuit board. A second circuit board is spaced apart from the first circuit board. A second driver portion comprises a set of second components mounted on or associated with the second circuit board, where the first driver portion and the second driver portion collectively are adapted to provide input signals to the control terminal of each semiconductor switch of an inverter. A first edge connector is mounted on the first circuit board. A second edge connector is mounted on the second circuit board.more » An interface board has mating edges that mate with the first edge connector and the second edge connector.« less

  10. Obsessive-compulsive disorder: Insights from animal models☆

    PubMed Central

    Szechtman, Henry; Ahmari, Susanne E.; Beninger, Richard J.; Eilam, David; Harvey, Brian H.; Edemann-Callesen, Henriette; Winter, Christine

    2017-01-01

    Research with animal models of obsessive-compulsive disorder (OCD) shows the following: (1) Optogenetic studies in mice provide evidence for a plausible cause-effect relation between increased activity in cortico-basal ganglia-thalamo-cortical (CBGTC) circuits and OCD by demonstrating the induction of compulsive behavior with the experimental manipulation of the CBGTC circuit. (2) Parallel use of several animal models is a fruitful paradigm to examine the mechanisms of treatment effects of deep brain stimulation in distinct OCD endophenotypes. (3) Features of spontaneous behavior in deer mice constitute a rich platform to investigate the neurobiology of OCD, social ramifications of a compulsive phenotype, and test novel drugs. (4) Studies in animal models for psychiatric disorders comorbid with OCD suggest comorbidity may involve shared neural circuits controlling expression of compulsive behavior. (5) Analysis of compulsive behavior into its constitutive components provides evidence from an animal model for a motivational perspective on OCD. (6) Methods of behavioral analysis in an animal model translate to dissection of compulsive rituals in OCD patients, leading to diagnostic tests. PMID:27168347

  11. Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications

    NASA Astrophysics Data System (ADS)

    Secondo, R.; Alía, R. Garcia; Peronnard, P.; Brugger, M.; Masi, A.; Danzeca, S.; Merlenghi, A.; Vaillé, J.-R.; Dusseau, L.

    2017-08-01

    A single event latchup (SEL) experiment based on commercial static random access memory (SRAM) memories has recently been proposed in the framework of the European Organization for Nuclear Research (CERN) Latchup Experiment and Student Satellite nanosatellite low Earth orbit (LEO) space mission. SEL characterization of three commercial SRAM memories has been carried out at the Paul Scherrer Institut (PSI) facility, using monoenergetic focused proton beams and different acquisition setups. The best target candidate was selected and a circuit for SEL detection has been proposed and tested at CERN, in the CERN High Energy AcceleRator Mixed-field facility (CHARM). Experimental results were carried out at test locations representative of the LEO environment, thus providing a full characterization of the SRAM cross sections, together with the analysis of the single-event effect and total ionizing dose of the latchup detection circuit in relation to the particle spectra expected during mission. The setups used for SEL monitoring are described, and details of the proposed circuit components and topology are presented. Experimental results obtained both at PSI and at CHARM facilities are discussed.

  12. Design of a signal conditioner for the Fermilab Magnet Test Facility

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Giannelli, Pietro

    2012-01-01

    This thesis describes the design of a remotely-programmable signal conditioner for the harmonic measurement of accelerator magnets. A 10-channel signal conditioning circuit featuring bucking capabilities was designed from scratch and implemented to the level of the printed circuit board layout. Other system components were chosen from those available on the market. Software design was started with the definition of routine procedures. This thesis is part of an upgrade project for replacing obsolescent automated test equipment belonging to the Fermilab Magnet Test Facility. The design started with a given set of requirements. Using a top-down approach, all the circuits were designedmore » and their expected performances were theoretically predicted and simulated. A limited prototyping phase followed. The printed circuit boards were laid out and routed using a CAD software and focusing the design on maximum electromagnetic interference immunity. An embedded board was selected for controlling and interfacing the signal conditioning circuitry with the instrumentation network. Basic low level routines for hardware access were defined. This work covered the entire design process of the signal conditioner, resulting in a project ready for manufacturing. The expected performances are in line with the requirements and, in the cases where this was not possible, approval of trade-offs was sought and received from the end users. Part I deals with the global structure of the signal conditioner and the subdivision in functional macro-blocks. Part II treats the hardware design phase in detail, covering the analog and digital circuits, the printed circuit layouts, the embedded controller and the power supply selection. Part III deals with the basic hardware-related routines to be implemented in the final software.« less

  13. Toolbox for the design of LiNbO3-based passive and active integrated quantum circuits

    NASA Astrophysics Data System (ADS)

    Sharapova, P. R.; Luo, K. H.; Herrmann, H.; Reichelt, M.; Meier, T.; Silberhorn, C.

    2017-12-01

    We present and discuss perspectives of current developments on advanced quantum optical circuits monolithically integrated in the lithium niobate platform. A set of basic components comprising photon pair sources based on parametric down conversion (PDC), passive routing elements and active electro-optically controllable switches and polarisation converters are building blocks of a toolbox which is the basis for a broad range of diverse quantum circuits. We review the state-of-the-art of these components and provide models that properly describe their performance in quantum circuits. As an example for applications of these models we discuss design issues for a circuit providing on-chip two-photon interference. The circuit comprises a PDC section for photon pair generation followed by an actively controllable modified mach-Zehnder structure for observing Hong-Ou-Mandel interference. The performance of such a chip is simulated theoretically by taking even imperfections of the properties of the individual components into account.

  14. Lightweight concentrator module with 30 percent AM0 efficient GaAs/GaSb tandem cells

    NASA Technical Reports Server (NTRS)

    Avery, J. E.; Fraas, L. M.; Sundaram, V. S.; Mansoori, N.; Yerkes, J. W.; Brinker, D. J.; Curtis, H. B.; O'Neill, M. J.

    1990-01-01

    A concept is presented for an aerospace concentrator module with lightweight domed lenses and 30 percent AM0 efficient GaAs/GaSb tandem solar cell circuits. The performance of transparent GaAs cells is reviewed. NASA's high-altitude jet flight calibration data for recent GaSb cells assembled with bulk GaAs filters are reported, along with subsequent Boeing and NASA measurements of GaSb I-V performance at various light levels and temperatures. The expected performance of a basic two-terminal tandem concentrator circuit with three-to-one voltage matching is discussed. All of the necessary components being developed to assemble complete flight test coupons are shown. Straightforward interconnect and assembly techniques yield voltage matched circuits with near-optimum performance over a wide temperature range.

  15. A representative-sandwich model for simultaneously coupled mechanical-electrical-thermal simulation of a lithium-ion cell under quasi-static indentation tests

    DOE PAGES

    Zhang, Chao; Santhanagopalan, Shriram; Sprague, Michael A.; ...

    2015-08-29

    The safety behavior of lithium-ion batteries under external mechanical crush is a critical concern, especially during large scale deployment. We previously presented a sequentially coupled mechanical-electrical-thermal modeling approach for studying mechanical abuse induced short circuit. Here in this work, we study different mechanical test conditions and examine the interaction between mechanical failure and electrical-thermal responses, by developing a simultaneous coupled mechanical-electrical-thermal model. The present work utilizes a single representative-sandwich (RS) to model the full pouch cell with explicit representations for each individual component such as the active material, current collector, separator, etc. Anisotropic constitutive material models are presented to describemore » the mechanical properties of active materials and separator. The model predicts accurately the force-strain response and fracture of battery structure, simulates the local failure of separator layer, and captures the onset of short circuit for lithium-ion battery cell under sphere indentation tests with three different diameters. Electrical-thermal responses to the three different indentation tests are elaborated and discussed. Lastly, numerical studies are presented to show the potential impact of test conditions on the electrical-thermal behavior of the cell after the occurrence of short circuit.« less

  16. A representative-sandwich model for simultaneously coupled mechanical-electrical-thermal simulation of a lithium-ion cell under quasi-static indentation tests

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Zhang, Chao; Santhanagopalan, Shriram; Sprague, Michael A.

    The safety behavior of lithium-ion batteries under external mechanical crush is a critical concern, especially during large scale deployment. We previously presented a sequentially coupled mechanical-electrical-thermal modeling approach for studying mechanical abuse induced short circuit. Here in this work, we study different mechanical test conditions and examine the interaction between mechanical failure and electrical-thermal responses, by developing a simultaneous coupled mechanical-electrical-thermal model. The present work utilizes a single representative-sandwich (RS) to model the full pouch cell with explicit representations for each individual component such as the active material, current collector, separator, etc. Anisotropic constitutive material models are presented to describemore » the mechanical properties of active materials and separator. The model predicts accurately the force-strain response and fracture of battery structure, simulates the local failure of separator layer, and captures the onset of short circuit for lithium-ion battery cell under sphere indentation tests with three different diameters. Electrical-thermal responses to the three different indentation tests are elaborated and discussed. Lastly, numerical studies are presented to show the potential impact of test conditions on the electrical-thermal behavior of the cell after the occurrence of short circuit.« less

  17. Electronics Reliability Fracture Mechanics, Volume 1. Causes of Failures of Shop Replaceable Units and Hybrid Microcircuits

    DTIC Science & Technology

    1992-05-01

    Plate Figure H-1. Temperature Coefficient Test Circuit The forward voltage was measured at 3 different termperatures. The average TC was calculated to be...AT, rather than the average figure given by the large area Isolation diffusion. The peak temperature , rather than the average temperature , is the...components would cause the temperatures of the components to be nearer the average , particularly those near the minimum and maximum. X-I The largest

  18. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, David M.

    1996-01-01

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit.

  19. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, D.M.

    1996-11-05

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit. 5 figs.

  20. Temperature-Dependent Short-Circuit Capability of Silicon Carbide Power MOSFETs

    DOE PAGES

    Wang, Zhiqiang; Shi, Xiaojie; Tolbert, Leon M.; ...

    2016-02-01

    Our paper presents a comprehensive short-circuit ruggedness evaluation and numerical investigation of up-to-date commercial silicon carbide (SiC) MOSFETs. The short-circuit capability of three types of commercial 1200-V SiC MOSFETs is tested under various conditions, with case temperatures from 25 to 200 degrees C and dc bus voltages from 400 to 750 V. It is found that the commercial SiC MOSFETs can withstand short-circuit current for only several microseconds with a dc bus voltage of 750 V and case temperature of 200 degrees C. Moreover, the experimental short-circuit behaviors are compared, and analyzed through numerical thermal dynamic simulation. Specifically, an electrothermalmore » model is built to estimate the device internal temperature distribution, considering the temperature-dependent thermal properties of SiC material. Based on the temperature information, a leakage current model is derived to calculate the main leakage current components (i.e., thermal, diffusion, and avalanche generation currents). Finally, numerical results show that the short-circuit failure mechanisms of SiC MOSFETs can be thermal generation current induced thermal runaway or high-temperature-related gate oxide damage.« less

  1. Comparison of two types of neonatal extracorporeal life support systems with pulsatile and nonpulsatile flow.

    PubMed

    Haines, Nikkole; Wang, Shigang; Myers, John L; Undar, Akif

    2009-11-01

    We compared the effects of two neonatal extracorporeal life support (ECLS) systems on circuit pressures and surplus hemodynamic energy levels in a simulated ECLS model. The clinical set-up included the Jostra HL-20 heart-lung machine, either the Medtronic ECMO (0800) or the MEDOS 800LT systems with company-provided circuit components, a 10 Fr arterial cannula, and a pseudo-patient. We tested the system in nonpulsatile and pulsatile flow modes at two flow rates using a 40/60 glycerin/water blood analog, for a total of 48 trials, with n = 6 for each set-up. The pressure drops over the Medtronic ECLS were significantly higher than those over the MEDOS system regardless of the flow rate or perfusion mode (144.8 +/- 0.2 mm Hg vs. 35.7 +/- 0.2 mm Hg, respectively, at 500 mL/min in nonpulsatile mode, P < 0.001). The preoxygenator mean arterial pressures were significantly increased and the precannula hemodynamic energy values were decreased with the Medtronic ECLS circuit. These results suggest that the MEDOS ECLS circuit better transmits hemodynamic energy to the patient, keeps mean circuit pressures lower, and has lower pressure drops than the Medtronic Circuit.

  2. Detection of circuit-board components with an adaptive multiclass correlation filter

    NASA Astrophysics Data System (ADS)

    Diaz-Ramirez, Victor H.; Kober, Vitaly

    2008-08-01

    A new method for reliable detection of circuit-board components is proposed. The method is based on an adaptive multiclass composite correlation filter. The filter is designed with the help of an iterative algorithm using complex synthetic discriminant functions. The impulse response of the filter contains information needed to localize and classify geometrically distorted circuit-board components belonging to different classes. Computer simulation results obtained with the proposed method are provided and compared with those of known multiclass correlation based techniques in terms of performance criteria for recognition and classification of objects.

  3. PUZZLE - A program for computer-aided design of printed circuit artwork

    NASA Technical Reports Server (NTRS)

    Harrell, D. A. W.; Zane, R.

    1971-01-01

    Program assists in solving spacing problems encountered in printed circuit /PC/ design. It is intended to have maximum use for two-sided PC boards carrying integrated circuits, and also aids design of discrete component circuits.

  4. Metal anesthesia circuit components stop the progression of laser fires.

    PubMed

    Sosis, M B; Braverman, B

    1994-01-01

    To determine whether metallic Y-pieces and elbows would halt the progression of a laser-induced endotracheal tube fire. A segment of polyvinyl chloride endotracheal tube was attached to either an all-plastic anesthesia circle breathing system (n = 5) or a circuit consisting of a metal Y-piece and elbow with plastic hoses (n = 5). In each case, an Nd-YAG laser was used to ignite the endotracheal tube segment and attached anesthesia circuit as 5 L/min of oxygen was flowing through them. Research laboratory of a university-affiliated metropolitan medical center. The flames from the endotracheal tubes burned through the 22 mm hoses that were part of the all-plastic circuits in 49.5 +/- 8.8 seconds (mean +/- SD). In none of the trials with the metal components did the fire advance beyond the endotracheal tube's 15 mm adapter. Metal circuit components halt the progression of laser-induced endotracheal tube fires toward the anesthesia machine.

  5. 21 CFR 814.39 - PMA supplements.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... sterilization procedures. (5) Changes in packaging. (6) Changes in the performance or design specifications, circuits, components, ingredients, principle of operation, or physical layout of the device. (7) Extension... the performance or design specifications, circuits, components, ingredients, principles of operation...

  6. Design, testing, and delivery of an interactive graphics display subsystem

    NASA Technical Reports Server (NTRS)

    Holmes, B.

    1973-01-01

    An interactive graphics display system was designed to be used in locating components on a printed circuit card and outputting data concerning their thermal values. The manner in which this was accomplished in terms of both hardware and software is described. An analysis of the accuracy of this approach is also included.

  7. A Common Function of Basal Ganglia-Cortical Circuits Subserving Speed in Both Motor and Cognitive Domains.

    PubMed

    Hanakawa, Takashi; Goldfine, Andrew M; Hallett, Mark

    2017-01-01

    Distinct regions of the frontal cortex connect with their basal ganglia and thalamic counterparts, constituting largely segregated basal ganglia-thalamo-cortical (BTC) circuits. However, any common role of the BTC circuits in different behavioral domains remains unclear. Indeed, whether dysfunctional motor and cognitive BTC circuits are responsible for motor slowing and cognitive slowing, respectively, in Parkinson's disease (PD) is a matter of debate. Here, we used an effortful behavioral paradigm in which the effects of task rate on accuracy were tested in movement, imagery, and calculation tasks in humans. Using nonlinear fitting, we separated baseline accuracy ( A base ) and "agility" (ability to function quickly) components of performance in healthy participants and then confirmed reduced agility and preserved A base for the three tasks in PD. Using functional magnetic resonance imaging (fMRI) and diffusion tractography, we explored the neural substrates underlying speeded performance of the three tasks in healthy participants, suggesting the involvement of distinct BTC circuits in cognitive and motor agility. Language and motor BTC circuits were specifically active during speeded performance of the calculation and movement tasks, respectively, whereas premotor BTC circuits revealed activity for speeded performance of all tasks. Finally, PD showed reduced task rate-correlated activity in the language BTC circuits for speeded calculation, in the premotor BTC circuit for speeded imagery, and in the motor BTC circuits for speeded movement, as compared with controls. The present study casts light on the anatomo-functional organization of the BTC circuits and their parallel roles in invigorating movement and cognition through a function of dopamine.

  8. A Common Function of Basal Ganglia-Cortical Circuits Subserving Speed in Both Motor and Cognitive Domains

    PubMed Central

    2017-01-01

    Abstract Distinct regions of the frontal cortex connect with their basal ganglia and thalamic counterparts, constituting largely segregated basal ganglia-thalamo-cortical (BTC) circuits. However, any common role of the BTC circuits in different behavioral domains remains unclear. Indeed, whether dysfunctional motor and cognitive BTC circuits are responsible for motor slowing and cognitive slowing, respectively, in Parkinson’s disease (PD) is a matter of debate. Here, we used an effortful behavioral paradigm in which the effects of task rate on accuracy were tested in movement, imagery, and calculation tasks in humans. Using nonlinear fitting, we separated baseline accuracy (Abase) and “agility” (ability to function quickly) components of performance in healthy participants and then confirmed reduced agility and preserved Abase for the three tasks in PD. Using functional magnetic resonance imaging (fMRI) and diffusion tractography, we explored the neural substrates underlying speeded performance of the three tasks in healthy participants, suggesting the involvement of distinct BTC circuits in cognitive and motor agility. Language and motor BTC circuits were specifically active during speeded performance of the calculation and movement tasks, respectively, whereas premotor BTC circuits revealed activity for speeded performance of all tasks. Finally, PD showed reduced task rate-correlated activity in the language BTC circuits for speeded calculation, in the premotor BTC circuit for speeded imagery, and in the motor BTC circuits for speeded movement, as compared with controls. The present study casts light on the anatomo-functional organization of the BTC circuits and their parallel roles in invigorating movement and cognition through a function of dopamine. PMID:29379873

  9. Dynamic balance of excitation and inhibition rapidly modulates spike probability and precision in feed-forward hippocampal circuits

    PubMed Central

    Wahlstrom-Helgren, Sarah

    2016-01-01

    Feed-forward inhibitory (FFI) circuits are important for many information-processing functions. FFI circuit operations critically depend on the balance and timing between the excitatory and inhibitory components, which undergo rapid dynamic changes during neural activity due to short-term plasticity (STP) of both components. How dynamic changes in excitation/inhibition (E/I) balance during spike trains influence FFI circuit operations remains poorly understood. In the current study we examined the role of STP in the FFI circuit functions in the mouse hippocampus. Using a coincidence detection paradigm with simultaneous activation of two Schaffer collateral inputs, we found that the spiking probability in the target CA1 neuron was increased while spike precision concomitantly decreased during high-frequency bursts compared with a single spike. Blocking inhibitory synaptic transmission revealed that dynamics of inhibition predominately modulates the spike precision but not the changes in spiking probability, whereas the latter is modulated by the dynamics of excitation. Further analyses combining whole cell recordings and simulations of the FFI circuit suggested that dynamics of the inhibitory circuit component may influence spiking behavior during bursts by broadening the width of excitatory postsynaptic responses and that the strength of this modulation depends on the basal E/I ratio. We verified these predictions using a mouse model of fragile X syndrome, which has an elevated E/I ratio, and found a strongly reduced modulation of postsynaptic response width during bursts. Our results suggest that changes in the dynamics of excitatory and inhibitory circuit components due to STP play important yet distinct roles in modulating the properties of FFI circuits. PMID:27605532

  10. Microcomputer control of an electronically commutated dc motor

    NASA Astrophysics Data System (ADS)

    El-Sharkawi, M. A.; Coleman, J. S.; Mehdi, I. S.; Sommer, D. L.

    A microcomputer control system for an electronically commutated dc motor (ECM) has been designed, built and tested. A 3-hp, 270-volt, samarium-cobalt brushless dc motor is controlled by an Intel 8086-based microcomputer. The main functions of the microcomputer are to control the speed of the motor, to provide forward or reverse rotation, to brake, and to protect the motor and its power electronic switching circuits from overcurrents. The necessary interface circuits were designed and built, and the system components have been integrated and tested. It is shown that the proposed ECM system with the microcomputer control operate the motor reliably over a wide range of speeds. The purpose of this effort is to develop the motorcontroller for driving electromechanical actuators for flight control and other aircraft applications.

  11. Real-time fast physical random number generator with a photonic integrated circuit.

    PubMed

    Ugajin, Kazusa; Terashima, Yuta; Iwakawa, Kento; Uchida, Atsushi; Harayama, Takahisa; Yoshimura, Kazuyuki; Inubushi, Masanobu

    2017-03-20

    Random number generators are essential for applications in information security and numerical simulations. Most optical-chaos-based random number generators produce random bit sequences by offline post-processing with large optical components. We demonstrate a real-time hardware implementation of a fast physical random number generator with a photonic integrated circuit and a field programmable gate array (FPGA) electronic board. We generate 1-Tbit random bit sequences and evaluate their statistical randomness using NIST Special Publication 800-22 and TestU01. All of the BigCrush tests in TestU01 are passed using 410-Gbit random bit sequences. A maximum real-time generation rate of 21.1 Gb/s is achieved for random bit sequences in binary format stored in a computer, which can be directly used for applications involving secret keys in cryptography and random seeds in large-scale numerical simulations.

  12. First On-Wafer Power Characterization of MMIC Amplifiers at Sub-Millimeter Wave Frequencies

    NASA Technical Reports Server (NTRS)

    Fung, A. K.; Gaier, T.; Samoska, L.; Deal, W. R.; Radisic, V.; Mei, X. B.; Yoshida, W.; Liu, P. S.; Uyeda, J.; Barsky, M.; hide

    2008-01-01

    Recent developments in semiconductor technology have enabled advanced submillimeter wave (300 GHz) transistors and circuits. These new high speed components have required new test methods to be developed for characterizing performance, and to provide data for device modeling to improve designs. Current efforts in progressing high frequency testing have resulted in on-wafer-parameter measurements up to approximately 340 GHz and swept frequency vector network analyzer waveguide measurements to 508 GHz. On-wafer noise figure measurements in the 270-340 GHz band have been demonstrated. In this letter we report on on-wafer power measurements at 330 GHz of a three stage amplifier that resulted in a maximum measured output power of 1.78mW and maximum gain of 7.1 dB. The method utilized demonstrates the extension of traditional power measurement techniques to submillimeter wave frequencies, and is suitable for automated testing without packaging for production screening of submillimeter wave circuits.

  13. Development and testing of a 180-volt dc electronic circuit breaker with a 335-ampere carry and 1200-ampere interrupt rating

    NASA Technical Reports Server (NTRS)

    Brush, A. S.; Phillips, R. L.

    1991-01-01

    NASA Lewis Research Center and associated contractors have conducted a program to assess the potential requirements for a high-current switch to conceptually design a switch using the best existing technology, and to build and demonstrate a breadboard which meets the requirements. The result is the high current remote bus isolator (HRBI). The HRBI is rated at 180 V dc, 335 A continuous with a 1200 A interrupt rating. It also incorporates remote-control and protective features called for by the Space Station Freedom PMAD dc test bed design. Two breadboard 335 A circuit breakers were built and tested that demonstrate a promising concept of paralleled current-limiting modules. The units incorporated all control and protective features required by advanced aerospace power systems. Component stresses in each unit were determined by design, and are consistent with a life of many thousands of fault operations.

  14. Network motifs – recurring circuitry components in biological systems

    EPA Science Inventory

    Environmental perturbations, elicited by chemicals, dietary supplements, and drugs, can alter the dynamics of the molecular circuits and networks operating in cells, leading to multiple disease endpoints. Multi-component signal transduction pathways and gene regulatory circuits u...

  15. Assessment of thermal loads in the CERN SPS crab cavities cryomodule 1

    DOE PAGES

    Carra, F.; Apeland, J.; Calaga, R.; ...

    2017-07-20

    As a part of the HL-LHC upgrade, we designed a cryomodule to host two crab cavities for a first test with protons in the SPS machine. The evaluation of the cryomodule heat loads is essential to dimension the cryogenic infrastructure of the system. The current design features two cryogenic circuits. The first circuit adopts superfluid helium at 2 K to maintain the cavities in the superconducting state. The second circuit, based on helium gas at a temperature between 50 K and 70 K, is connected to the thermal screen, also serving as heat intercept for all the interfaces between themore » cold mass and the external environment. We present an overview of the heat loads to both circuits, and the combined numerical and analytical estimations. The heat load of each element is detailed for the static and dynamic scenarios, with considerations on the design choices for the thermal optimization of the most critical components.« less

  16. Development of a unit cell for a Ge:Ga detector array

    NASA Technical Reports Server (NTRS)

    1988-01-01

    Two modules of gallium-doped germanium (Ge:Ga) infrared detectors with integrated multiplexing readouts and supporting drive electronics were designed and tested. This development investigated the feasibility of producing two-dimensional Ge:Ga arrays by stacking linear modules in a housing capable of providing uniaxial stress for enhanced long-wavelength response. Each module includes 8 detectors (1x1x2 mm) mounted to a sapphire board. The element spacing is 12 microns. The back faces of the detector elements are beveled with an 18 deg angle, which was proved to significantly enhance optical absorption. Each module includes a different silicon metal-oxide semiconductor field effect transistor (MOSFET) readout. The first circuit was built from discrete MOSFET components; the second incorporated devices taken from low-temperature integrated circuit multiplexers. The latter circuit exhibited much lower stray capacitance and improved stability. Using these switched-FET circuits, it was demonstrated that burst readout, with multiplexer active only during the readout period, could successfully be implemented at approximately 3.5 K.

  17. SDVSRM - a new SSRM based technique featuring dynamically adjusted, scanner synchronized sample voltages for measurement of actively operated devices.

    PubMed

    Doering, Stefan; Wachowiak, Andre; Roetz, Hagen; Eckl, Stefan; Mikolajick, Thomas

    2018-06-01

    Scanning spreading resistance microscopy (SSRM) with its high spatial resolution and high dynamic signal range is a powerful tool for two-dimensional characterization of semiconductor dopant areas. However, the application of the method is limited to devices in equilibrium condition, as the investigation of actively operated devices would imply potential differences within the device, whereas SSRM relies on a constant voltage difference between sample surface and probe tip. Furthermore, the standard preparation includes short circuiting of all device components, limiting applications to devices in equilibrium condition. In this work scanning dynamic voltage spreading resistance microscopy (SDVSRM), a new SSRM based two pass atomic force microscopy (AFM) technique is introduced, overcoming these limitations. Instead of short circuiting the samples during preparation, wire bond devices are used allowing for active control of the individual device components. SDVSRM consists of two passes. In the first pass the local sample surface voltage dependent on the dc biases applied to the components of the actively driven device is measured as in scanning voltage microscopy (SVM). The local spreading resistance is measured within the second pass, in which the afore obtained local surface voltage is used to dynamically adjust the terminal voltages of the device under test. This is done in a way that the local potential difference across the nano-electrical contact matches the software set SSRM measurement voltage, and at the same time, the internal voltage differences within the device under test are maintained. In this work the proof of the concept could be demonstrated by obtaining spreading resistance data of an actively driven photodiode test device. SDVSRM adds a higher level of flexibility in general to SSRM, as occurring differences in cross section surface voltage are taken into account. These differences are immanent for actively driven devices, but can also be present at standard, short circuited samples. Therefore, SDVSRM could improve the characterization under equilibrium conditions as well. Copyright © 2018. Published by Elsevier B.V.

  18. Waveshaping electronic circuit

    NASA Technical Reports Server (NTRS)

    Harper, T. P.

    1971-01-01

    Circuit provides output signal with sinusoidal function in response to bipolar transition of input signal. Instantaneous transition shapes into linear rate of change and linear rate of change shapes into sinusoidal rate of change. Circuit contains only active components; therefore, compatibility with integrated circuit techniques is assured.

  19. SIRU utilization. Volume 1: Theory, development and test evaluation

    NASA Technical Reports Server (NTRS)

    Musoff, H.

    1974-01-01

    The theory, development, and test evaluations of the Strapdown Inertial Reference Unit (SIRU) are discussed. The statistical failure detection and isolation, single position calibration, and self alignment techniques are emphasized. Circuit diagrams of the system components are provided. Mathematical models are developed to show the performance characteristics of the subsystems. Specific areas of the utilization program are identified as: (1) error source propagation characteristics and (2) local level navigation performance demonstrations.

  20. AC-impedance measurements during thermal runaway process in several lithium/polymer batteries

    NASA Astrophysics Data System (ADS)

    Uchida, I.; Ishikawa, H.; Mohamedi, M.; Umeda, M.

    In this work, we present a set of thermal characterization experiments of charged prismatic polymer lithium-ion battery (PLB) comparatively with those of a lithium-ion battery (LIB). These cells at different state of charge (SOC) were tested inside an accelerated rate calorimeter (ARC) to determine the onset-of-thermal runaway (OTR) temperatures. In addition, the thermally activated components of these cells were followed by monitoring the impedance (at 1 kHz) and the open-circuit voltage (OCV) as a function of temperature. An increase in the impedance was observed at around 133 °C corresponding to the polyethylene separator shutdown. Above 140 °C, the OCV dropped to zero indicating an internal short-circuit due the separator meltdown suggesting that the pinholes created in the separator at meltdown are large enough to create an internal short-circuit.

  1. SAFETY SYSTEM FOR CONTROL ROD

    DOEpatents

    Paget, J.A.

    1963-05-14

    A structure for monitoring the structural continuity of a control rod foi a neutron reactor is presented. A electric conductor readily breakable under mechanical stress is fastened along the length of the control rod at a plurality of positions and forms a closed circuit with remote electrical components responsive to an open circuit. A portion of the conductor between the control rod and said components is helically wound to allow free and normally unrestricted movement of the segment of conductor secured to the control rod relative to the remote components. Any break in the circuit is indicative of control rod breakage. (AEC)

  2. An expert-based model for selecting the most suitable substrate material type for antenna circuits

    NASA Astrophysics Data System (ADS)

    AL-Oqla, Faris M.; Omar, Amjad A.

    2015-06-01

    Quality and properties of microwave circuits depend on all the circuit components. One of these components is the substrate. The process of substrate material selection is a decision-making problem that involves multicriteria with objectives that are diverse and conflicting. The aim of this work was to select the most suitable substrate material type to be used in antennas in the microwave frequency range that gives best performance and reliability of the substrate. For this purpose, a model was built to ease the decision-making that includes hierarchical alternatives and criteria. The substrate material type options considered were limited to fiberglass-reinforced epoxy laminates (FR4 εr = 4.8), aluminium (III) oxide (alumina εr = 9.6), gallium arsenide III-V compound (GaAs εr = 12.8) and PTFE composites reinforced with glass microfibers (Duroid εr = 2.2-2.3). To assist in building the model and making decisions, the analytical hierarchy process (AHP) was used. The decision-making process revealed that alumina substrate material type was the most suitable choice for the antennas in the microwave frequency range that yields best performance and reliability. In addition, both the size of the circuit and the loss tangent of the substrates were found to be the most contributing subfactors in the antenna circuit specifications criterion. Experimental assessments were conducted utilising The Expert Choice™ software. The judgments were tested and found to be precise, consistent and justifiable, and the marginal inconsistency values were found to be very narrow. A sensitivity analysis was also presented to demonstrate the confidence in the drawn conclusions.

  3. 19 CFR 10.14 - Fabricated components subject to the exemption.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... assembled, such as transistors, diodes, integrated circuits, machinery parts, or precut parts of wearing..., or integrated circuit wafers containing individual integrated circuit dice which have been scribed or... resulted in a substantial transformation of the foreign copper ingots. Example 2. An integrated circuit...

  4. Memristor-CMOS hybrid integrated circuits for reconfigurable logic.

    PubMed

    Xia, Qiangfei; Robinett, Warren; Cumbie, Michael W; Banerjee, Neel; Cardinali, Thomas J; Yang, J Joshua; Wu, Wei; Li, Xuema; Tong, William M; Strukov, Dmitri B; Snider, Gregory S; Medeiros-Ribeiro, Gilberto; Williams, R Stanley

    2009-10-01

    Hybrid reconfigurable logic circuits were fabricated by integrating memristor-based crossbars onto a foundry-built CMOS (complementary metal-oxide-semiconductor) platform using nanoimprint lithography, as well as materials and processes that were compatible with the CMOS. Titanium dioxide thin-film memristors served as the configuration bits and switches in a data routing network and were connected to gate-level CMOS components that acted as logic elements, in a manner similar to a field programmable gate array. We analyzed the chips using a purpose-built testing system, and demonstrated the ability to configure individual devices, use them to wire up various logic gates and a flip-flop, and then reconfigure devices.

  5. The ac power line protection for an IEEE 587 Class B environment

    NASA Technical Reports Server (NTRS)

    Roehr, W. D.; Clark, O. M.

    1984-01-01

    The 587B series of protectors are unique, low clamping voltage transient suppressors to protect ac-powered equipment from the 6000V peak open-circuit voltage and 3000A short circuit current as defined in IEEE standard 587 for Category B transients. The devices, which incorporate multiple-stage solid-state protector components, were specifically designed to operate under multiple exposures to maximum threat levels in this severe environment. The output voltage peaks are limited to 350V under maximum threat conditions for a 120V ac power line, thus providing adequate protection to vulnerable electronic equipment. The principle of operation and test performance data is discussed.

  6. Simulation by bondgraphs

    NASA Astrophysics Data System (ADS)

    Thoma, Jean Ulrich

    The fundamental principles and applications of the bond graph method, in which a system is represented on paper by letter elements and their interconnections (bonds), are presented in an introduction for engineering students. Chapters are devoted to simulation and graphical system models; bond graphs as networks for power and signal exchange; the simulation and design of mechanical engineering systems; the simulation of fluid power systems and hydrostatic devices; electrical circuits, drives, and components; practical procedures and problems of bond-graph-based numerical simulation; and applications to thermodynamics, chemistry, and biology. Also included are worked examples of applications to robotics, shocks and collisions, ac circuits, hydraulics, and a hydropneumatic fatigue-testing machine.

  7. Development and evaluation of superconducting circuit elements

    NASA Technical Reports Server (NTRS)

    Haertling, Gene H.; Lee, Burtrand; Hsi, Dennis; Modi, Vibhakar; Marone, Matt

    1990-01-01

    An approach to the application of high Tc ceramic superconductors to practical circuit elements was developed and demonstrated. This method, known as the rigid-conductor process (RCP), involves the combination of a pre-formed, sintered, and tested superconductor material with an appropriate, rigid substrate via an epoxy adhesive which also serves to encapsulate the element from the ambient environment. Emphasis was on the practical means to achieve functional, reliable, and reproducible components. Although all of the work described in this report involved a YBa2Cu3Osub(7-x) high Tc superconductor material, the techniques developed and conclusions reached are equally applicable to other high Tc materials.

  8. Inexpensive but accurate driving circuits for quartz crystal microbalances

    NASA Astrophysics Data System (ADS)

    Bruschi, L.; Delfitto, G.; Mistura, G.

    1999-01-01

    The quartz crystal microbalance (QCM) is a common technique which finds a wide variety of applications in many different areas like adsorption, catalysis, analytical chemistry, biochemistry, etc., and more generally as a sensor in the investigation of viscoelastic films. In this article we describe some driving circuits of the quartz which we have realized and tested in our laboratory. These can be assembled with standard components which can be easily found. Their performance, in some cases, is as good as that of the much more expensive frequency modulation technique employed in very precise QCM measurements and which requires high-quality commercial radiofrequency generators and amplifiers.

  9. Parameters Design of Series Resonant Inverter Circuit

    NASA Astrophysics Data System (ADS)

    Qi, Xingkun; Peng, Yonglong; Li, Yabin

    This paper analyzes the main circuit structure of series resonant inverter, and designs the components parameters of the main circuit.That provides a theoretical method for the design of series resonant inverter.

  10. Component-Level Electronic-Assembly Repair (CLEAR) Spacecraft Circuit Diagnostics by Analog and Complex Signature Analysis

    NASA Technical Reports Server (NTRS)

    Oeftering, Richard C.; Wade, Raymond P.; Izadnegahdar, Alain

    2011-01-01

    The Component-Level Electronic-Assembly Repair (CLEAR) project at the NASA Glenn Research Center is aimed at developing technologies that will enable space-flight crews to perform in situ component-level repair of electronics on Moon and Mars outposts, where there is no existing infrastructure for logistics spares. These technologies must provide effective repair capabilities yet meet the payload and operational constraints of space facilities. Effective repair depends on a diagnostic capability that is versatile but easy to use by crew members that have limited training in electronics. CLEAR studied two techniques that involve extensive precharacterization of "known good" circuits to produce graphical signatures that provide an easy-to-use comparison method to quickly identify faulty components. Analog Signature Analysis (ASA) allows relatively rapid diagnostics of complex electronics by technicians with limited experience. Because of frequency limits and the growing dependence on broadband technologies, ASA must be augmented with other capabilities. To meet this challenge while preserving ease of use, CLEAR proposed an alternative called Complex Signature Analysis (CSA). Tests of ASA and CSA were used to compare capabilities and to determine if the techniques provided an overlapping or complementary capability. The results showed that the methods are complementary.

  11. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, L.B.

    1998-08-18

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

  12. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, Lowell B.

    1998-01-01

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.

  13. Aging and failure mode of electrochemical double layer capacitors during accelerated constant load tests

    NASA Astrophysics Data System (ADS)

    Kötz, R.; Ruch, P. W.; Cericola, D.

    Electrochemical double layer capacitors of the BCAP0350 type (Maxwell Technologies) were tested under constant load conditions at different voltages and temperatures. The aging of the capacitors was monitored during the test in terms of capacitance, internal resistance and leakage current. Aging was significantly accelerated by elevated temperature or increased voltage. Only for extreme conditions at voltages of 3.5 V or temperatures above 70 °C the capacitors failed due to internal pressure build-up. No other failure events such as open circuit or short circuit were detected. Impedance measurements after the tests showed increased high frequency resistance, an increased distributed resistance and most likely an increase in contact resistance between electrode and current collector together with a loss of capacitance. Capacitors aged at elevated voltages (3.3 V) exhibited a tilting of the low frequency component, which implies an increase in the heterogeneity of the electrode surface. This feature was not observed upon aging at elevated temperatures (70 °C).

  14. 21 CFR 1020.10 - Television receivers.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ..., under normal usage, are not accessible to the user. (4) Television receiver means an electronic product designed to receive and display a television picture through broadcast, cable, or closed circuit television... from that component or circuit failure which maximizes x-radiation emissions. (4) Critical component...

  15. 21 CFR 1020.10 - Television receivers.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ..., under normal usage, are not accessible to the user. (4) Television receiver means an electronic product designed to receive and display a television picture through broadcast, cable, or closed circuit television... from that component or circuit failure which maximizes x-radiation emissions. (4) Critical component...

  16. 21 CFR 1020.10 - Television receivers.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ..., under normal usage, are not accessible to the user. (4) Television receiver means an electronic product designed to receive and display a television picture through broadcast, cable, or closed circuit television... from that component or circuit failure which maximizes x-radiation emissions. (4) Critical component...

  17. 21 CFR 1020.10 - Television receivers.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ..., under normal usage, are not accessible to the user. (4) Television receiver means an electronic product designed to receive and display a television picture through broadcast, cable, or closed circuit television... from that component or circuit failure which maximizes x-radiation emissions. (4) Critical component...

  18. 21 CFR 1020.10 - Television receivers.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ..., under normal usage, are not accessible to the user. (4) Television receiver means an electronic product designed to receive and display a television picture through broadcast, cable, or closed circuit television... from that component or circuit failure which maximizes x-radiation emissions. (4) Critical component...

  19. Design and development of a low-cost biphasic charge-balanced functional electric stimulator and its clinical validation.

    PubMed

    Shendkar, Chandrashekhar; Lenka, Prasanna K; Biswas, Abhishek; Kumar, Ratnesh; Mahadevappa, Manjunatha

    2015-10-01

    Functional electric stimulators that produce near-ideal, charge-balanced biphasic stimulation waveforms with interphase delay are considered safer and more efficacious than conventional stimulators. An indigenously designed, low-cost, portable FES device named InStim is developed. It features a charge-balanced biphasic single channel. The authors present the complete design, mathematical analysis of the circuit and the clinical evaluation of the device. The developed circuit was tested on stroke patients affected by foot drop problems. It was tested both under laboratory conditions and in clinical settings. The key building blocks of this circuit are low dropout regulators, a DC-DC voltage booster and a single high-power current source OP-Amp with current-limiting capabilities. This allows the device to deliver high-voltage, constant current, biphasic pulses without the use of a bulky step-up transformer. The advantages of the proposed design over the currently existing devices include improved safety features (zero DC current, current-limiting mechanism and safe pulses), waveform morphology that causes less muscle fatigue, cost-effectiveness and compact power-efficient circuit design with minimal components. The device is also capable of producing appropriate ankle dorsiflexion in patients having foot drop problems of various Medical Research Council scale grades.

  20. Modelling, Simulation and Construction of a DC/DC Boost Power Converter: A School Experimental System

    ERIC Educational Resources Information Center

    Silva-Ortigoza, R.; Silva-Ortigoza, G.; Hernandez-Guzman, V. M.; Saldana-Gonzalez, G.; Marcelino-Aranda, M.; Marciano-Melchor, M.

    2012-01-01

    We introduce a dc/dc boost power converter as a didactic prototype intended to support courses on electric circuit analysis experimentally. The corresponding mathematical model is obtained, the converter is designed and an experimental setup is described, constructed and tested. Simplicity of construction as well as low cost of components renders…

  1. NASA Tech Briefs, May 1995. Volume 19, No. 5

    NASA Technical Reports Server (NTRS)

    1995-01-01

    This issue features an resource report on Jet Propulsion Laboratory and a special focus on advanced composites and plastics. It also contains articles on electronic components and circuits, electronic systems, physical sciences, computer programs, mechanics, machinery, manufacturing and fabrication, mathematics and information sciences, and life sciences. This issue also contains a supplement on federal laboratory test and measurements.

  2. Current Space Station Experiments Investigating Component Level Electronics Repair

    NASA Technical Reports Server (NTRS)

    Easton, John W.; Struk, Peter M.

    2010-01-01

    The Soldering in a Reduced Gravity Experiment (SoRGE) and Component Repair Experiment (CRE)-1 are tests performed on the International Space Station to determine the techniques, tools, and training necessary to allow future crews to perform manual electronics repairs at the component level. SoRGE provides information on the formation and internal structure of through-hole solder joints, illustrating the challenges and implications of soldering in reduced gravity. SoRGE showed a significant increase in internal void defects for joints formed in low gravity compared to normal gravity. Methods for mitigating these void defects were evaluated using a modified soldering process. CRE-1 demonstrated the removal, cleaning, and replacement of electronics components by manual means on functional circuit boards. The majority of components successful passed a post-repair functional test demonstrating the feasibility of component-level repair within the confines of a spacecraft. Together, these tasks provide information to recommend material and tool improvements, training improvements, and future work to help enable electronics repairs in future space missions.

  3. Test module development to detect the flase call probe pins on microeprocessor test equipment

    NASA Astrophysics Data System (ADS)

    Tang, L. W.; Ong, N. R.; Mohamad, I. S. B.; Alcain, J. B.; Retnasamy, V.

    2017-09-01

    Probe pins are useful for electrical testing of microelectronic components, printed circuit board assembly (PCBA), microprocessors and other electronic devices due to it provides the conductivity test based on specific device circuit design. During the repeatable test runs, the load of test modules, contact failures and the current conductivity induces layer wear off all the tip of probe pins contact. Contamination will be build-up on probe pins and increased contact resistivity which results of cost loss and time loss for rectifying programs, rectifying testers and exchanging new probe pins. In this study, a resistivity approach will be developed to provide "Testing of Test Probes". The test module based on "Four-wire Ohm measurement" method with two alternative ways of applying power supply, that are 9V from a single power supply and 5V from Arduino UNO power supply were demonstrated to measure the small resistance value of microprocessor probe pin. A microcontroller with VEE Pro software was used to record the measurement data. The accuracy of both test modules were calibrated under different temperature conditions and result shows that 9V from a single power supply test module has higher measurement accuracy.

  4. Gaseous Microemboli and the Influence of Microporous Membrane Oxygenators

    PubMed Central

    Weitkemper, Heinz-H.; Oppermann, Bernd; Spilker, Andreas; Knobl, Hermann-J.; Körfer, Reiner

    2005-01-01

    Abstract: Gaseous microemboli (GME) are still an unsolved problem of extracorporeal circuits. They are associated with organ injury during cardiopulmonary bypass. Microbubbles of different sizes and number are generated in the blood as the result of different components of the extracorporeal circuit as well as surgical maneuvers. The aim of our study was to observe the behavior of microporous membrane oxygenators to GME in the daily use and in an in vitro model. For the detection of microbubbles, we used a two-channel ultrasonic bubble counter based on 2-MHz Doppler-System with special ultrasound probes. The amount and size of GME were monitored before and after membrane. In 28 scheduled cases with 3 different oxygenators and variability of surgical procedures, we observed the bubble activity in the extracorporeal circuit. In addition, we used an in-vitro model to study the ability of six different oxygenators by removing air in various tests. The oxygenators tested were manufactured with different membrane technologies. The results of our investigations showed varying membrane design lead to a partial removal of GME as well as a change in size and numbers of microbubbles. PMID:16350377

  5. System design and operation of a 100 kilovolt, 2 kilohertz pulse modulator for plasma source ion implantation

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Reass, W.A.

    1994-07-01

    This paper describes the electrical design and operation of a high power modulator system implemented for the Los Alamos Plasma Source Ion Implantation (PSII) facility. To test the viability of the PSII process for various automotive components, the modulator must accept wide variations of load impedance. Components have varying area and composition which must be processed with different plasmas. Additionally, the load impedance may change by large factors during the typical 20 uS pulse, due to plasma displacement currents and sheath growth. As a preliminary design to test the system viability for automotive component implantation, suitable for a manufacturing environment,more » circuit topology must be able to directly scale to high power versions, for increased component through-put. We have chosen an evolutionary design approach with component families of characterized performance, which should Ion result in a reliable modulator system with component lifetimes. The modulator utilizes a pair of Litton L-3408 hollow beam amplifier tubes as switching elements in a ``hot-deck`` configuration. Internal to the main of planar triode hot deck, an additional pair decks, configured in a totem pole circuit, provide input drive to the L-3408 mod-anodes. The modulator can output over 2 amps average current (at 100 kV) with 1 kW of modanode drive. Diagnostic electronics monitor the load and stops pulses for 100 mS when a load arcs occur. This paper, in addition to providing detailed engineering design information, will provide operational characteristics and reliability data that direct the design to the higher power, mass production line capable modulators.« less

  6. Delta connected resonant snubber circuit

    DOEpatents

    Lai, J.S.; Peng, F.Z.; Young, R.W. Sr.; Ott, G.W. Jr.

    1998-01-20

    A delta connected, resonant snubber-based, soft switching, inverter circuit achieves lossless switching during dc-to-ac power conversion and power conditioning with minimum component count and size. Current is supplied to the resonant snubber branches solely by the dc supply voltage through the main inverter switches and the auxiliary switches. Component count and size are reduced by use of a single semiconductor switch in the resonant snubber branches. Component count is also reduced by maximizing the use of stray capacitances of the main switches as parallel resonant capacitors. Resonance charging and discharging of the parallel capacitances allows lossless, zero voltage switching. In one embodiment, circuit component size and count are minimized while achieving lossless, zero voltage switching within a three-phase inverter. 36 figs.

  7. Delta connected resonant snubber circuit

    DOEpatents

    Lai, Jih-Sheng; Peng, Fang Zheng; Young, Sr., Robert W.; Ott, Jr., George W.

    1998-01-01

    A delta connected, resonant snubber-based, soft switching, inverter circuit achieves lossless switching during dc-to-ac power conversion and power conditioning with minimum component count and size. Current is supplied to the resonant snubber branches solely by the dc supply voltage through the main inverter switches and the auxiliary switches. Component count and size are reduced by use of a single semiconductor switch in the resonant snubber branches. Component count is also reduced by maximizing the use of stray capacitances of the main switches as parallel resonant capacitors. Resonance charging and discharging of the parallel capacitances allows lossless, zero voltage switching. In one embodiment, circuit component size and count are minimized while achieving lossless, zero voltage switching within a three-phase inverter.

  8. SpaceHab 1 maintenance experiment

    NASA Technical Reports Server (NTRS)

    Bohannon, Jackie W.

    1994-01-01

    The SpaceHab 1 flight on STS-57 served as a test platform for evaluation of two space station payloads. The first payload evaluated a space station maintenance concept using a sweep signal generator and a 48-channel logic analyzer to perform fault detection and isolation. Crew procedures files, test setup diagram files, and software to configure the test equipment were created on the ground and uplinked on the astronauts' voice communication circuit to perform tests in flight. In order to use these files, the portable computer was operated in a multi-window configuration. The test data transmitted to the ground allowing the ground staff to identify the cause of the fault and provide the crew with the repair procedures and diagrams. The crew successfully repaired the system under test. The second payload investigated hand soldering and de-soldering of standard components on printed circuit (PC) boards in zero gravity. It also used a new type of intra-vehicular foot restraints which uses the neutral body posture in zero-g to provide retention of the crew without their conscious attention.

  9. Failure analysis of pinch-torsion tests as a thermal runaway risk evaluation method of Li-ion cells

    NASA Astrophysics Data System (ADS)

    Xia, Yuzhi; Li, Tianlei; Ren, Fei; Gao, Yanfei; Wang, Hsin

    2014-11-01

    Recently a pinch-torsion test is developed for safety testing of Li-ion batteries. It has been demonstrated that this test can generate small internal short-circuit spots in the separator in a controllable and repeatable manner. In the current research, the failure mechanism is examined by numerical simulations and comparisons to experimental observations. Finite element models are developed to evaluate the deformation of the separators under both pure pinch and pinch-torsion loading conditions. It is discovered that the addition of the torsion component significantly increased the maximum first principal strain, which is believed to induce the internal short circuit. In addition, the applied load in the pinch-torsion test is significantly less than in the pure pinch test, thus dramatically improving the applicability of this method to ultra-thick batteries which otherwise require heavy load in excess of machine capability. It is further found that the separator failure is achieved in the early stage of torsion (within a few degree of rotation). Effect of coefficient of friction on the maximum first principal strain is also examined.

  10. A High-Temperature Piezoresistive Pressure Sensor with an Integrated Signal-Conditioning Circuit.

    PubMed

    Yao, Zong; Liang, Ting; Jia, Pinggang; Hong, Yingping; Qi, Lei; Lei, Cheng; Zhang, Bin; Xiong, Jijun

    2016-06-18

    This paper focuses on the design and fabrication of a high-temperature piezoresistive pressure sensor with an integrated signal-conditioning circuit, which consists of an encapsulated pressure-sensitive chip, a temperature compensation circuit and a signal-conditioning circuit. A silicon on insulation (SOI) material and a standard MEMS process are used in the pressure-sensitive chip fabrication, and high-temperature electronic components are adopted in the temperature-compensation and signal-conditioning circuits. The entire pressure sensor achieves a hermetic seal and can be operated long-term in the range of -50 °C to 220 °C. Unlike traditional pressure sensor output voltage ranges (in the dozens to hundreds of millivolts), the output voltage of this sensor is from 0 V to 5 V, which can significantly improve the signal-to-noise ratio and measurement accuracy in practical applications of long-term transmission based on experimental verification. Furthermore, because this flexible sensor's output voltage is adjustable, general follow-up pressure transmitter devices for voltage converters need not be used, which greatly reduces the cost of the test system. Thus, the proposed high-temperature piezoresistive pressure sensor with an integrated signal-conditioning circuit is expected to be highly applicable to pressure measurements in harsh environments.

  11. A High-Temperature Piezoresistive Pressure Sensor with an Integrated Signal-Conditioning Circuit

    PubMed Central

    Yao, Zong; Liang, Ting; Jia, Pinggang; Hong, Yingping; Qi, Lei; Lei, Cheng; Zhang, Bin; Xiong, Jijun

    2016-01-01

    This paper focuses on the design and fabrication of a high-temperature piezoresistive pressure sensor with an integrated signal-conditioning circuit, which consists of an encapsulated pressure-sensitive chip, a temperature compensation circuit and a signal-conditioning circuit. A silicon on insulation (SOI) material and a standard MEMS process are used in the pressure-sensitive chip fabrication, and high-temperature electronic components are adopted in the temperature-compensation and signal-conditioning circuits. The entire pressure sensor achieves a hermetic seal and can be operated long-term in the range of −50 °C to 220 °C. Unlike traditional pressure sensor output voltage ranges (in the dozens to hundreds of millivolts), the output voltage of this sensor is from 0 V to 5 V, which can significantly improve the signal-to-noise ratio and measurement accuracy in practical applications of long-term transmission based on experimental verification. Furthermore, because this flexible sensor’s output voltage is adjustable, general follow-up pressure transmitter devices for voltage converters need not be used, which greatly reduces the cost of the test system. Thus, the proposed high-temperature piezoresistive pressure sensor with an integrated signal-conditioning circuit is expected to be highly applicable to pressure measurements in harsh environments. PMID:27322288

  12. Environmental performance evaluation of an advanced-design solid-state television camera

    NASA Technical Reports Server (NTRS)

    1979-01-01

    The development of an advanced-design black-and-white solid-state television camera which can survive exposure to space environmental conditions was undertaken. A 380 x 488 element buried-channel CCD is utilized as the image sensor to ensure compatibility with 525-line transmission and display equipment. Specific camera design approaches selected for study and analysis included: (1) component and circuit sensitivity to temperature; (2) circuit board thermal and mechanical design; and (3) CCD temperature control. Preferred approaches were determined and integrated into the final design for two deliverable solid-state TV cameras. One of these cameras was subjected to environmental tests to determine stress limits for exposure to vibration, shock, acceleration, and temperature-vacuum conditions. These tests indicate performance at the design goal limits can be achieved for most of the specified conditions.

  13. Onboard calibration circuit for the DAMPE BGO calorimeter front-end electronics

    NASA Astrophysics Data System (ADS)

    Zhang, De-Liang; Feng, Chang-Qing; Zhang, Jun-Bin; Wang, Qi; Ma, Si-Yuan; Shen, Zhong-Tao; Jiang, Di; Gao, Shan-Shan; Zhang, Yun-Long; Guo, Jian-Hua; Liu, Shu-Bin; An, Qi

    2016-05-01

    DAMPE (DArk Matter Particle Explorer) is a scientific satellite which is mainly aimed at indirectly searching for dark matter in space. One critical sub-detector of the DAMPE payload is the BGO (bismuth germanium oxide) calorimeter, which contains 1848 PMT (photomultiplier tube) dynodes and 16 FEE (Front-End Electronics) boards. VA160 and VATA160, two 32-channel low power ASICs (Application Specific Integrated Circuits), are adopted as the key components on the FEEs to perform charge measurement for the PMT signals. In order to monitor the parameter drift which may be caused by temperature variation, aging, or other environmental factors, an onboard calibration circuit is designed for the VA160 and VATA160 ASICs. It is mainly composed of a 12-bit DAC (Digital to Analog Converter), an operational amplifier and an analog switch. Test results showed that a dynamic range of 0-30 pC with a precision of 5 fC (Root Meam Square, RMS) was achieved, which covers the VA160’s input range. It can be used to compensate for the temperature drift and test the trigger function of the FEEs. The calibration circuit has been implemented for the front-end electronics of the BGO Calorimeter and verified by all the environmental tests for both Qualification Model and Flight Model of DAMPE. The DAMPE satellite was launched at the end of 2015 and the calibration circuit will operate periodically in space. Supported by Strategic Priority Research Program on Space Science of Chinese Academy of Sciences (XDA04040202-4), and National Basic Research Program (973 Program) of China (2010CB833002) and National Natural Science Foundation of China (11273070)

  14. Predicting better performance on a college preparedness test from narrative comprehension at the age of 6 years: An fMRI study.

    PubMed

    Horowitz-Kraus, Tzipi; Eaton, Kenneth; Farah, Rola; Hajinazarian, Ardag; Vannest, Jennifer; Holland, Scott K

    2015-12-10

    To investigate whether high performance on college preparedness tests at 18 years of age can be predicted from brain activation patterns during narrative comprehension at 5-7 years of age. In this longitudinal study, functional MRI data during an auditory narrative-comprehension task were acquired from 15 children (5-7 years of age) who also provided their American College Testing (ACT) scores at the age of 18 years. Active voxels during the narrative-comprehension task were correlated with both composite ACT scores and the reading-comprehension component of the exam. Higher composite ACT scores and behavioral scores for reading comprehension were positively correlated with greater activation in frontal and anterior brain regions during the narrative-comprehension task. Our results suggest that neural circuits supporting higher ACT performance are predictable from a narrative-comprehension task at the age of 5-7 years. This supports a critical role for the anterior cingulate cortex, which is a part of the cingulo-opercular cognitive-control network early in development, as a facilitator for better ACT scores. This study highlights that shared neural circuits that support overall ACT performance and neural circuits that support reading comprehension both rely on neural circuits related to narrative comprehension in childhood, suggesting that interventions involving narrative comprehension should be considered for individuals with reading and other academic difficulties. Copyright © 2015 Elsevier B.V. All rights reserved.

  15. A device for testing cables

    NASA Technical Reports Server (NTRS)

    Hayhurst, Arthur Ray (Inventor)

    1993-01-01

    A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield, and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

  16. Joining dissimilar stainless steels for pressure vessel components

    NASA Astrophysics Data System (ADS)

    Sun, Zheng; Han, Huai-Yue

    1994-03-01

    A series of studies was carried out to examine the weldability and properties of dissimilar steel joints between martensitic and austenitic stainless steels - F6NM (OCr13Ni4Mo) and AISI 347, respectively. Such joints are important parts in, e.g. the primary circuit of a pressurized water reactor (PWR). This kind of joint requires both good mechanical properties, corrosion resistance and a stable magnetic permeability besides good weldability. The weldability tests included weld thermal simulation of the martensitic steel for investigating the influence of weld thermal cycles and post-weld heat treatment (PWHT) on the mechanical properties of the heat-affected zone (HAZ); implant testing for examining the tendency for cold cracking of martensitic steel; rigid restraint testing for determining hot crack susceptibility of the multi-pass dissimilar steel joints. The joints were subjected to various mechanical tests including a tensile test, bending test and impact test at various temperatures, as well as slow strain-rate test for examining the stress corrosion cracking tendency in the simulated environment of a primary circuit of a PWR. The results of various tests indicated that the quality of the tube/tube joints is satisfactory for meeting all the design requirements.

  17. Parameter space of experimental chaotic circuits with high-precision control parameters.

    PubMed

    de Sousa, Francisco F G; Rubinger, Rero M; Sartorelli, José C; Albuquerque, Holokx A; Baptista, Murilo S

    2016-08-01

    We report high-resolution measurements that experimentally confirm a spiral cascade structure and a scaling relationship of shrimps in the Chua's circuit. Circuits constructed using this component allow for a comprehensive characterization of the circuit behaviors through high resolution parameter spaces. To illustrate the power of our technological development for the creation and the study of chaotic circuits, we constructed a Chua circuit and study its high resolution parameter space. The reliability and stability of the designed component allowed us to obtain data for long periods of time (∼21 weeks), a data set from which an accurate estimation of Lyapunov exponents for the circuit characterization was possible. Moreover, this data, rigorously characterized by the Lyapunov exponents, allows us to reassure experimentally that the shrimps, stable islands embedded in a domain of chaos in the parameter spaces, can be observed in the laboratory. Finally, we confirm that their sizes decay exponentially with the period of the attractor, a result expected to be found in maps of the quadratic family.

  18. Sampling and Control Circuit Board for an Inertial Measurement Unit

    NASA Technical Reports Server (NTRS)

    Chelmins, David; Powis, Rick

    2012-01-01

    Spacesuit navigation is one component of NASA s efforts to return humans to the Moon. Studies performed at the NASA Glenn Research Center (GRC) considered various navigation technologies and filtering approaches to enable navigation on the lunar surface. As part of this effort, microelectromechanical systems (MEMS) inertial measurement units (IMUs) were studied to determine if they could supplement a radiometric infrastructure. MEMS IMUs were included in the Lunar Extra-Vehicular Activity Crewmember Location Determination System (LECLDS) testbed during NASA s annual Desert Research and Technology Studies (D-RATS) event in 2009 and 2010. The testbed included one IMU in 2009 and three IMUs in 2010, along with a custom circuit board interfacing between the navigation processor and each IMU. The board was revised for the 2010 test, and this paper documents the design details of this latest revision of the interface circuit board and firmware.

  19. Analysis of complex environment effect on near-field emission

    NASA Astrophysics Data System (ADS)

    Ravelo, B.; Lalléchère, S.; Bonnet, P.; Paladian, F.

    2014-10-01

    The article is dealing with uncertainty analyses of radiofrequency circuits electromagnetic compatibility emission based on the near-field/near-field (NF/NF) transform combined with stochastic approach. By using 2D data corresponding to electromagnetic (EM) field (X=E or H) scanned in the observation plane placed at the position z0 above the circuit under test (CUT), the X field map was extracted. Then, uncertainty analyses were assessed via the statistical moments from X component. In addition, stochastic collocation based was considered and calculations were applied to planar EM NF radiated by the CUTs as Wilkinson power divider and a microstrip line operating at GHz levels. After Matlab implementation, the mean and standard deviation were assessed. The present study illustrates how the variations of environmental parameters may impact EM fields. The NF uncertainty methodology can be applied to any physical parameter effects in complex environment and useful for printed circuit board (PCBs) design guideline.

  20. E-Learning System for Experiments Involving Construction of Practical Electronic Circuits

    ERIC Educational Resources Information Center

    Takemura, Atsushi

    2013-01-01

    This paper proposes a novel e-learning system for technical experiments involving the construction of practical electronic circuits; this system would meet the various demands of individual experimenters. This mixed mode is beneficial for practical use in that an experimenter who does not have sufficient circuit components for circuit making can…

  1. Module Twelve: Series AC Resistive-Reactive Circuits; Basic Electricity and Electronics Individualized Learning System.

    ERIC Educational Resources Information Center

    Bureau of Naval Personnel, Washington, DC.

    The module covers series circuits which contain both resistive and reactive components and methods of solving these circuits for current, voltage, impedance, and phase angle. The module is divided into six lessons: voltage and impedance in AC (alternating current) series circuits, vector computations, rectangular and polar notation, variational…

  2. Embedded electronics for intelligent structures

    NASA Astrophysics Data System (ADS)

    Warkentin, David J.; Crawley, Edward F.

    The signal, power, and communications provisions for the distributed control processing, sensing, and actuation of an intelligent structure could benefit from a method of physically embedding some electronic components. The preliminary feasibility of embedding electronic components in load-bearing intelligent composite structures is addressed. A technique for embedding integrated circuits on silicon chips within graphite/epoxy composite structures is presented which addresses the problems of electrical, mechanical, and chemical isolation. The mechanical and chemical isolation of test articles manufactured by this technique are tested by subjecting them to static and cyclic mechanical loads and a temperature/humidity/bias environment. The likely failure modes under these conditions are identified, and suggestions for further improvements in the technique are discussed.

  3. 3-D printed 2.4 GHz rectifying antenna for wireless power transfer applications

    NASA Astrophysics Data System (ADS)

    Skinner, Matthew

    In this work, a 3D printed rectifying antenna that operates at the 2.4GHz WiFi band was designed and manufactured. The printed material did not have the same properties of bulk material, so the printed materials needed to be characterized. The antenna and rectifying circuit was printed out of Acrylonitrile Butadiene Styrene (ABS) filament and a conductive silver paste, with electrical components integrated into the circuit. Before printing the full rectifying antenna, each component was printed and evaluated. The printed antenna operated at the desired frequency with a return loss of -16 dBm with a bandwidth of 70MHz. The radiation pattern was measured in an anechoic chamber with good matching to the model. The rectifying circuit was designed in Ansys Circuit Simulation using Schottky diodes to enable the circuit to operate at lower input power levels. Two rectifying circuits were manufactured, one by printing the conductive traces with silver ink, and one with traces made from copper. The printed silver ink is less conductive than the bulk copper and therefore the output voltage of the printed rectifier was lower than the copper circuit. The copper circuit had an efficiency of 60% at 0dBm and the printed silver circuit had an efficiency of 28.6% at 0dBm. The antenna and rectifying circuits were then connected to each other and the performance was compared to a fully printed integrated rectifying antenna. The rectifying antennas were placed in front of a horn antenna while changing the power levels at the antenna. The efficiency of the whole system was lower than the individual components but an efficiency of 11% at 10dBm was measured.

  4. 30 CFR 27.24 - Power-shutoff component.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... the machine or equipment when actuated by the methane detector at a methane concentration of 2.0... actuated by the methane detector, cause a control circuit to shut down the machine or equipment on which it...-shutoff component shall, when actuated by the methane detector, cause a control circuit to deenergize the...

  5. 30 CFR 27.24 - Power-shutoff component.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... the machine or equipment when actuated by the methane detector at a methane concentration of 2.0... actuated by the methane detector, cause a control circuit to shut down the machine or equipment on which it...-shutoff component shall, when actuated by the methane detector, cause a control circuit to deenergize the...

  6. 30 CFR 27.24 - Power-shutoff component.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... the machine or equipment when actuated by the methane detector at a methane concentration of 2.0... actuated by the methane detector, cause a control circuit to shut down the machine or equipment on which it...-shutoff component shall, when actuated by the methane detector, cause a control circuit to deenergize the...

  7. 30 CFR 27.24 - Power-shutoff component.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... the machine or equipment when actuated by the methane detector at a methane concentration of 2.0... actuated by the methane detector, cause a control circuit to shut down the machine or equipment on which it...-shutoff component shall, when actuated by the methane detector, cause a control circuit to deenergize the...

  8. A novel approach in extracorporeal circulation: individual, integrated, and interactive heart-lung assist (I3-Assist).

    PubMed

    Wagner, Georg; Schlanstein, Peter; Fiehe, Sandra; Kaufmann, Tim; Kopp, Rüdger; Bensberg, Ralf; Schmitz-Rode, Thomas; Steinseifer, Ulrich; Arens, Jutta

    2014-04-01

    Extracorporeal life support (ECLS) is a well-established technique for the treatment of different cardiac and pulmonary diseases, e.g., congenital heart disease and acute respiratory distress syndrome. Additionally, severely ill patients who cannot be weaned from the heart-lung machine directly after surgery have to be put on ECLS for further therapy. Although both systems include identical components, a seamless transition is not possible yet. The adaption of the circuit to the patients' size and demand is limited owing to the components available. The project I³-Assist aims at a novel concept for extracorporeal circulation. To better match the patient's therapeutic demand of support, an individual number of one-size oxygenators and heat exchangers will be combined. A seamless transition between cardiopulmonary bypass and ECLS will be possible as well as the exchange of components during therapy to enhance circuit maintenance throughout long-term support. Until today, a novel oxygenator and heat exchanger along with a simplified manufacturing protocol have been established. The first layouts of the unit to allow the spill- and bubble-free connection and disconnection of modules as well as improved cannulas and a rotational pump are investigated using computational fluid dynamics. Tests were performed according to current guidelines in vitro and in vivo. The test results show the feasibility and potential of the concept.

  9. Automatic method of measuring silicon-controlled-rectifier holding current

    NASA Technical Reports Server (NTRS)

    Maslowski, E. A.

    1972-01-01

    Development of automated silicon controlled rectifier circuit for measuring minimum anode current required to maintain rectifiers in conducting state is discussed. Components of circuit are described and principles of operation are explained. Illustration of circuit is provided.

  10. Multiple frequency bioelectrical impedance analysis: a cross-validation study of the inductor circuit and Cole models.

    PubMed

    Ward, L; Cornish, B H; Paton, N I; Thomas, B J

    1999-11-01

    It has been proposed that multiple frequency bioelectrical impedance models of the human body should include an inductive property for the circulatory system, the inductor circuit model (ICM), and that such a model, when coupled with a new method of data analysis, can improve the predictive power of multiple frequency bioelectrical impedance analysis (MFBIA). This hypothesis was tested using MFBIA measurements and gold standard measures of total body and extracellular water volumes in a cross-validation study in two subject groups (viz. controls and HIV). The MFBIA measurements were analysed using the current, widely accepted Cole model and the alternative ICM model which includes an inductive component. Correlations in the range 0.75 to 0.92 (for TBW) and 0.46 to 0.79 (for ECW) for impedance quotients versus gold standard measures within the subject groups were observed. These decreased, to as low as r = 0.50 for TBW and r = 0.29 for ECW, when the derived algorithms were applied to the alternative subject group. These results suggest that lack of portability of MFBIA algorithms between subject groups is not due to an inadequacy of the analogue circuit model per se but is possibly due more to fundamental flaws in the principles associated with its application. These include assuming a constant proportionality of body segment geometries and tissue fluid resistivities. This study has also demonstrated that this inadequacy cannot be overcome by simply introducing an inductive component into the analogue electrical circuit.

  11. An innovative approach to predict technology evolution for the desoldering of printed circuit boards: A perspective from China and America.

    PubMed

    Wang, Chen; Zhao, Wu; Wang, Jie; Chen, Ling; Luo, Chun-Jing

    2016-06-01

    The printed circuit boards basis of electronic equipment have seen a rapid growth in recent years and played a significant role in modern life. Nowadays, the fact that electronic devices upgrade quickly necessitates a proper management of waste printed circuit boards. Non-destructive desoldering of waste printed circuit boards becomes the first and the most crucial step towards recycling electronic components. Owing to the diversity of materials and components, the separation process is difficult, which results in complex and expensive recovery of precious materials and electronic components from waste printed circuit boards. To cope with this problem, we proposed an innovative approach integrating Theory of Inventive Problem Solving (TRIZ) evolution theory and technology maturity mapping system to forecast the evolution trends of desoldering technology of waste printed circuit boards. This approach can be applied to analyse the technology evolution, as well as desoldering technology evolution, then research and development strategy and evolution laws can be recommended. As an example, the maturity of desoldering technology is analysed with a technology maturity mapping system model. What is more, desoldering methods in different stages are analysed and compared. According to the analysis, the technological evolution trends are predicted to be 'the law of energy conductivity' and 'increasing the degree of idealisation'. And the potential technology and evolutionary state of waste printed circuit boards are predicted, offering reference for future waste printed circuit boards recycling. © The Author(s) 2016.

  12. Monolithic integrated circuit charge amplifier and comparator for MAMA readout

    NASA Technical Reports Server (NTRS)

    Cole, Edward H.; Smeins, Larry G.

    1991-01-01

    Prototype ICs for the Solar Heliospheric Observatory's Multi-Anode Microchannel Array (MAMA) have been developed; these ICs' charge-amplifier and comparator components were then tested with a view to pulse response and noise performance. All model performance predictions have been exceeded. Electrostatic discharge protection has been included on all IC connections; device operation over temperature has been consistent with model predictions.

  13. AUTOMOTIVE DIESEL MAINTENANCE 2. UNIT XII, LEARNING ABOUT BATTERY SERVICING AND TESTING (PART I).

    ERIC Educational Resources Information Center

    Human Engineering Inst., Cleveland, OH.

    THID MODULE OF A 25-MODULE COURSE IS DESIGNED TO DEVELOP AN UNDERSTANDING OF THE CONSTRUCTION AND MAINTENANCE OF LEAD-ACID STORAGE BATTERIES USED ON DIESEL POWERED EQUIPMENT. TOPICS ARE (1) BATTERY COMPONENTS AND CONSTRUCTION, (2) CHEMICAL ACTION IN BATTERIES, (3) THE BATTERY AND THE CHARGING CIRCUIT, (4) BATTERY CHARGING VOLTAGE, (5) EFFECTS OF…

  14. Annual Conference on Nuclear and Space Radiation Effects, 17th, Cornell University, Ithaca, N.Y., July 15-18, 1980, Proceedings

    NASA Technical Reports Server (NTRS)

    Mcgarrity, J. M.

    1980-01-01

    The conference covered the radiation effects on devices, circuits, and systems, physics and basic radiation effects in materials, dosimetry and radiation transport, spacecraft charging, and space radiation effects. Other subjects included single particle upset phenomena, systems-generated electromagnetic pulse phenomena, fabrication of hardened components, testing techniques, and hardness assurance.

  15. Device for testing continuity and/or short circuits in a cable

    NASA Technical Reports Server (NTRS)

    Hayhurst, Arthur R. (Inventor)

    1995-01-01

    A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of the cable. The pair of connectors electrically connects the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

  16. A Integrated Circuit for a Biomedical Capacitive Pressure Transducer

    NASA Astrophysics Data System (ADS)

    Smith, Michael John Sebastian

    Medical research has an urgent need for a small, accurate, stable, low-power, biocompatible and inexpensive pressure sensor with a zero to full-scale range of 0-300 mmHg. An integrated circuit (IC) for use with a capacitive pressure transducer was designed, built and tested. The random pressure measurement error due to resolution and non-linearity is (+OR-)0.4 mmHg (at mid-range with a full -scale of 300 mmHg). The long-term systematic error due to falling battery voltage is (+OR-)0.6 mmHg. These figures were calculated from measurements of temperature, supply dependence and non-linearity on completed integrated circuits. The sensor IC allows measurement of temperature to (+OR-)0.1(DEGREES)C to allow for temperature compensation of the transducer. Novel micropower circuit design of the system components enabled these levels of accuracy to be reached. Capacitance is measured by a new ratiometric scheme employing an on -chip reference capacitor. This method greatly reduces the effects of voltage supply, temperature and manufacturing variations on the sensor circuit performance. The limits on performance of the bandgap reference circuit fabricated with a standard bipolar process using ion-implanted resistors were determined. Measurements confirm the limits of temperature stability as approximately (+OR-)300 ppm/(DEGREES)C. An exact analytical expression for the period of the Schmitt trigger oscillator, accounting for non-constant capacitor charging current, was formulated. Experiments to test agreement with theory showed that prediction of the oscillator period was very accurate. The interaction of fundamental and practical limits on the scaling of the transducer size was investigated including a correction to previous theoretical analysis of jitter in an RC oscillator. An areal reduction of 4 times should be achievable.

  17. Assembling surface mounted components on ink-jet printed double sided paper circuit board.

    PubMed

    Andersson, Henrik A; Manuilskiy, Anatoliy; Haller, Stefan; Hummelgård, Magnus; Sidén, Johan; Hummelgård, Christine; Olin, Håkan; Nilsson, Hans-Erik

    2014-03-07

    Printed electronics is a rapidly developing field where many components can already be manufactured on flexible substrates by printing or by other high speed manufacturing methods. However, the functionality of even the most inexpensive microcontroller or other integrated circuit is, at the present time and for the foreseeable future, out of reach by means of fully printed components. Therefore, it is of interest to investigate hybrid printed electronics, where regular electrical components are mounted on flexible substrates to achieve high functionality at a low cost. Moreover, the use of paper as a substrate for printed electronics is of growing interest because it is an environmentally friendly and renewable material and is, additionally, the main material used for many packages in which electronics functionalities could be integrated. One of the challenges for such hybrid printed electronics is the mounting of the components and the interconnection between layers on flexible substrates with printed conductive tracks that should provide as low a resistance as possible while still being able to be used in a high speed manufacturing process. In this article, several conductive adhesives are evaluated as well as soldering for mounting surface mounted components on a paper circuit board with ink-jet printed tracks and, in addition, a double sided Arduino compatible circuit board is manufactured and programmed.

  18. Modeling the frequency response of microwave radiometers with QUCS

    NASA Astrophysics Data System (ADS)

    Zonca, A.; Roucaries, B.; Williams, B.; Rubin, I.; D'Arcangelo, O.; Meinhold, P.; Lubin, P.; Franceschet, C.; Jahn, S.; Mennella, A.; Bersanelli, M.

    2010-12-01

    Characterization of the frequency response of coherent radiometric receivers is a key element in estimating the flux of astrophysical emissions, since the measured signal depends on the convolution of the source spectral emission with the instrument band shape. Laboratory Radio Frequency (RF) measurements of the instrument bandpass often require complex test setups and are subject to a number of systematic effects driven by thermal issues and impedance matching, particularly if cryogenic operation is involved. In this paper we present an approach to modeling radiometers bandpasses by integrating simulations and RF measurements of individual components. This method is based on QUCS (Quasi Universal Circuit Simulator), an open-source circuit simulator, which gives the flexibility of choosing among the available devices, implementing new analytical software models or using measured S-parameters. Therefore an independent estimate of the instrument bandpass is achieved using standard individual component measurements and validated analytical simulations. In order to automate the process of preparing input data, running simulations and exporting results we developed the Python package python-qucs and released it under GNU Public License. We discuss, as working cases, bandpass response modeling of the COFE and Planck Low Frequency Instrument (LFI) radiometers and compare results obtained with QUCS and with a commercial circuit simulator software. The main purpose of bandpass modeling in COFE is to optimize component matching, while in LFI they represent the best estimation of frequency response, since end-to-end measurements were strongly affected by systematic effects.

  19. Photovoltaic array space power plus diagnostics experiment

    NASA Technical Reports Server (NTRS)

    Burger, D. R.

    1990-01-01

    The objective is to summarize the five years of hardware development and fabrication represented by the Photovoltaic Array Space Power Plus Diagnostics (PASP Plus) Instrument. The original PASP Experiment requirements and background is presented along with the modifications which were requested to transform the PASP Experiment into the PASP Plus Instrument. The PASP Plus hardware and software is described. Test results for components and subsystems are given as well as final system tests. Also included are appendices which describe the major subsystems and present supporting documentation such as block diagrams, schematics, circuit board artwork, drawings, test procedures and test reports.

  20. The NASA computer aided design and test system

    NASA Technical Reports Server (NTRS)

    Gould, J. M.; Juergensen, K.

    1973-01-01

    A family of computer programs facilitating the design, layout, evaluation, and testing of digital electronic circuitry is described. CADAT (computer aided design and test system) is intended for use by NASA and its contractors and is aimed predominantly at providing cost effective microelectronic subsystems based on custom designed metal oxide semiconductor (MOS) large scale integrated circuits (LSIC's). CADAT software can be easily adopted by installations with a wide variety of computer hardware configurations. Its structure permits ease of update to more powerful component programs and to newly emerging LSIC technologies. The components of the CADAT system are described stressing the interaction of programs rather than detail of coding or algorithms. The CADAT system provides computer aids to derive and document the design intent, includes powerful automatic layout software, permits detailed geometry checks and performance simulation based on mask data, and furnishes test pattern sequences for hardware testing.

  1. Measuring the RC time constant with Arduino

    NASA Astrophysics Data System (ADS)

    Pereira, N. S. A.

    2016-11-01

    In this work we use the Arduino UNO R3 open source hardware platform to assemble an experimental apparatus for the measurement of the time constant of an RC circuit. With adequate programming, the Arduino is used as a signal generator, a data acquisition system and a basic signal visualisation tool. Theoretical calculations are compared with direct observations from an analogue oscilloscope. Data processing and curve fitting is performed on a spreadsheet. The results obtained for the six RC test circuits are within the expected interval of values defined by the tolerance of the components. The hardware and software prove to be adequate to the proposed measurements and therefore adaptable to a laboratorial teaching and learning context.

  2. Protective Socket For Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Wilkinson, Chris; Henegar, Greg

    1988-01-01

    Socket for intergrated circuits (IC's) protects from excessive voltages and currents or from application of voltages and currents in wrong sequence during insertion or removal. Contains built-in switch that opens as IC removed, disconnecting leads from signals and power. Also protects other components on circuit board from transients produced by insertion and removal of IC. Makes unnecessary to turn off power to entire circuit board so other circuits on board continue to function.

  3. Performance prediction for silicon photonics integrated circuits with layout-dependent correlated manufacturing variability.

    PubMed

    Lu, Zeqin; Jhoja, Jaspreet; Klein, Jackson; Wang, Xu; Liu, Amy; Flueckiger, Jonas; Pond, James; Chrostowski, Lukas

    2017-05-01

    This work develops an enhanced Monte Carlo (MC) simulation methodology to predict the impacts of layout-dependent correlated manufacturing variations on the performance of photonics integrated circuits (PICs). First, to enable such performance prediction, we demonstrate a simple method with sub-nanometer accuracy to characterize photonics manufacturing variations, where the width and height for a fabricated waveguide can be extracted from the spectral response of a racetrack resonator. By measuring the spectral responses for a large number of identical resonators spread over a wafer, statistical results for the variations of waveguide width and height can be obtained. Second, we develop models for the layout-dependent enhanced MC simulation. Our models use netlist extraction to transfer physical layouts into circuit simulators. Spatially correlated physical variations across the PICs are simulated on a discrete grid and are mapped to each circuit component, so that the performance for each component can be updated according to its obtained variations, and therefore, circuit simulations take the correlated variations between components into account. The simulation flow and theoretical models for our layout-dependent enhanced MC simulation are detailed in this paper. As examples, several ring-resonator filter circuits are studied using the developed enhanced MC simulation, and statistical results from the simulations can predict both common-mode and differential-mode variations of the circuit performance.

  4. CMOS based capacitance to digital converter circuit for MEMS sensor

    NASA Astrophysics Data System (ADS)

    Rotake, D. R.; Darji, A. D.

    2018-02-01

    Most of the MEMS cantilever based system required costly instruments for characterization, processing and also has large experimental setups which led to non-portable device. So there is a need of low cost, highly sensitive, high speed and portable digital system. The proposed Capacitance to Digital Converter (CDC) interfacing circuit converts capacitance to digital domain which can be easily processed. Recent demand microcantilever deflection is part per trillion ranges which change the capacitance in 1-10 femto farad (fF) range. The entire CDC circuit is designed using CMOS 250nm technology. Design of CDC circuit consists of a D-latch and two oscillators, namely Sensor controlled oscillator (SCO) and digitally controlled oscillator (DCO). The D-latch is designed using transmission gate based MUX for power optimization. A CDC design of 7-stage, 9-stage and 11-stage tested for 1-18 fF and simulated using mentor graphics Eldo tool with parasitic. Since the proposed design does not use resistance component, the total power dissipation is reduced to 2.3621 mW for CDC designed using 9-stage SCO and DCO.

  5. An Analogue VLSI Implementation of the Meddis Inner Hair Cell Model

    NASA Astrophysics Data System (ADS)

    McEwan, Alistair; van Schaik, André

    2003-12-01

    The Meddis inner hair cell model is a widely accepted, but computationally intensive computer model of mammalian inner hair cell function. We have produced an analogue VLSI implementation of this model that operates in real time in the current domain by using translinear and log-domain circuits. The circuit has been fabricated on a chip and tested against the Meddis model for (a) rate level functions for onset and steady-state response, (b) recovery after masking, (c) additivity, (d) two-component adaptation, (e) phase locking, (f) recovery of spontaneous activity, and (g) computational efficiency. The advantage of this circuit, over other electronic inner hair cell models, is its nearly exact implementation of the Meddis model which can be tuned to behave similarly to the biological inner hair cell. This has important implications on our ability to simulate the auditory system in real time. Furthermore, the technique of mapping a mathematical model of first-order differential equations to a circuit of log-domain filters allows us to implement real-time neuromorphic signal processors for a host of models using the same approach.

  6. Gallium Arsenide Pilot Line for High Performance Components

    DTIC Science & Technology

    1988-06-02

    shown in Figure 4. A complete functional and timing verification was performed by GOALIE , MOTIS, and ADVICE tools. GOALIE was used to convert the...using LTX2 and was verified using GOALIE , and ADVICE. S The performance of the circuits was measured using 256 test-vectors on an Advantest T3340...cycling per MIL STD 883C, Method 1010.7 Condition C. No evidence of damage was found. A sample of fifteen leads were pull tested per MIL STD 883C. Method

  7. High-level neutron coincidence counter maintenance manual

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Swansen, J.; Collinsworth, P.

    1983-05-01

    High-level neutron coincidence counter operational (field) calibration and usage is well known. This manual makes explicit basic (shop) check-out, calibration, and testing of new units and is a guide for repair of failed in-service units. Operational criteria for the major electronic functions are detailed, as are adjustments and calibration procedures, and recurrent mechanical/electromechanical problems are addressed. Some system tests are included for quality assurance. Data on nonstandard large-scale integrated (circuit) components and a schematic set are also included.

  8. Commutation circuit for an HVDC circuit breaker

    DOEpatents

    Premerlani, William J.

    1981-01-01

    A commutation circuit for a high voltage DC circuit breaker incorporates a resistor capacitor combination and a charging circuit connected to the main breaker, such that a commutating capacitor is discharged in opposition to the load current to force the current in an arc after breaker opening to zero to facilitate arc interruption. In a particular embodiment, a normally open commutating circuit is connected across the contacts of a main DC circuit breaker to absorb the inductive system energy trapped by breaker opening and to limit recovery voltages to a level tolerable by the commutating circuit components.

  9. Commutation circuit for an HVDC circuit breaker

    DOEpatents

    Premerlani, W.J.

    1981-11-10

    A commutation circuit for a high voltage DC circuit breaker incorporates a resistor capacitor combination and a charging circuit connected to the main breaker, such that a commutating capacitor is discharged in opposition to the load current to force the current in an arc after breaker opening to zero to facilitate arc interruption. In a particular embodiment, a normally open commutating circuit is connected across the contacts of a main DC circuit breaker to absorb the inductive system energy trapped by breaker opening and to limit recovery voltages to a level tolerable by the commutating circuit components. 13 figs.

  10. Simple photometer circuits using modular electronic components

    NASA Technical Reports Server (NTRS)

    Wampler, J. E.

    1975-01-01

    Operational and peak holding amplifiers are discussed as useful circuits for bioluminescence assays. Circuit diagrams are provided. While analog methods can give a good integration on short time scales, digital methods were found best for long term integration in bioluminescence assays. Power supplies, a general photometer circuit with ratio capability, and variations in the basic photometer design are also considered.

  11. The test of VLSI circuits

    NASA Astrophysics Data System (ADS)

    Baviere, Ph.

    Tests which have proven effective for evaluating VLSI circuits for space applications are described. It is recommended that circuits be examined after each manfacturing step to gain fast feedback on inadequacies in the production system. Data from failure modes which occur during operational lifetimes of circuits also permit redefinition of the manufacturing and quality control process to eliminate the defects identified. Other tests include determination of the operational envelope of the circuits, examination of the circuit response to controlled inputs, and the performance and functional speeds of ROM and RAM memories. Finally, it is desirable that all new circuits be designed with testing in mind.

  12. Pyrotechnic hazards classification and evaluation program. Electrostatic vulnerability of the E8 and XM15/XM165 clusters, phase 2

    NASA Technical Reports Server (NTRS)

    1971-01-01

    An investigation into the electrostatic phenomena associated with the manufacturing and handling of explosives is discussed. The testing includes measurement of the severity of the primary charge generation mechanism, triboelectric effects between dissimilar surfaces; refinement of equivalent circuits of the XM15/XM165 and E8 fuse trains; evaluation of the electrostatic spark discharge characteristics predicted by an equivalent circuit analysis; and determination of the spark ignition sensitivity of materials, components, junctions, and subassemblies which compose the XM15/XM165 and E8 units. Special studies were also performed. These special tests included ignition sensitivity of the complete XM15 fuse train when subjected to discharges through its entire length, measurement of electrostatic potentials which occur during the E8 foaming operation during fabrication, and investigation of the inadvertent functioning of an XM15 cluster during manufacturing. The test results are discussed and related to the effectiveness of suggested modification to reduce the electrostatic ignition sensitivity.

  13. Modular thought in the circuit analysis

    NASA Astrophysics Data System (ADS)

    Wang, Feng

    2018-04-01

    Applied to solve the problem of modular thought, provides a whole for simplification's method, the complex problems have become of, and the study of circuit is similar to the above problems: the complex connection between components, make the whole circuit topic solution seems to be more complex, and actually components the connection between the have rules to follow, this article mainly tells the story of study on the application of the circuit modular thought. First of all, this paper introduces the definition of two-terminal network and the concept of two-terminal network equivalent conversion, then summarizes the common source resistance hybrid network modular approach, containing controlled source network modular processing method, lists the common module, typical examples analysis.

  14. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least once... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  15. Comparing Online to Face-To-Face Delivery of Undergraduate Digital Circuits Content

    ERIC Educational Resources Information Center

    LaMeres, Brock J.; Plumb, Carolyn

    2014-01-01

    This paper presents a comparison of online to traditional face-to-face delivery of undergraduate digital systems material. Two specific components of digital content were compared and evaluated: a sophomore logic circuits course with no laboratory, and a microprocessor laboratory component of a junior-level computer systems course. For each of…

  16. Solar cell array design handbook - The principles and technology of photovoltaic energy conversion

    NASA Technical Reports Server (NTRS)

    Rauschenbach, H. S.

    1980-01-01

    Photovoltaic solar cell array design and technology for ground-based and space applications are discussed from the user's point of view. Solar array systems are described, with attention given to array concepts, historical development, applications and performance, and the analysis of array characteristics, circuits, components, performance and reliability is examined. Aspects of solar cell array design considered include the design process, photovoltaic system and detailed array design, and the design of array thermal, radiation shielding and electromagnetic components. Attention is then given to the characteristics and design of the separate components of solar arrays, including the solar cells, optical elements and mechanical elements, and the fabrication, testing, environmental conditions and effects and material properties of arrays and their components are discussed.

  17. Shielded multi-stage EMI noise filter

    DOEpatents

    Kisner, Roger Allen; Fugate, David Lee

    2016-11-08

    Electromagnetic interference (EMI) noise filter embodiments and methods for filtering are provided herein. EMI noise filters include multiple signal exclusion enclosures. The multiple signal exclusion enclosures contain filter circuit stages. The signal exclusion enclosures can attenuate noise generated external to the enclosures and/or isolate noise currents generated by the corresponding filter circuits within the enclosures. In certain embodiments, an output of one filter circuit stage is connected to an input of the next filter circuit stage. The multiple signal exclusion enclosures can be chambers formed using conductive partitions to divide an outer signal exclusion enclosure. EMI noise filters can also include mechanisms to maintain the components of the filter circuit stages at a consistent temperature. For example, a metal base plate can distribute heat among filter components, and an insulating material can be positioned inside signal exclusion enclosures.

  18. An improved instantaneous frequency meter for use with a multi-trace CRO: re-examination of the principles involved.

    PubMed

    Obara, S; Nagai, T

    1983-01-01

    The instantaneous frequency display of single unit discharges provides a useful measure of neuronal activities. Such a device must produce voltage outputs proportional to the reciprocal of each inter-spike interval by on-line computation of the hyperbola of V = a/t. Segment approximation of the required hyperbola can be made by a series of exponential functions which increase in time constants by a factor of m. Numerical analysis of a normalized function indicates possible error maxima of 3.4, 2.4 and 1.1% for m of 2, 1.8 and 1.5, respectively. This prediction is fully confirmed by the actual performance where m of 1.5 is adopted. The test circuit combines only readily available ICs and other components, to give a linear F-V conversion over a dynamic range of 4-600 Hz with error maxima of approximately 1%. The outputs are square pulses of approximately 1.5 ms in duration through the use of a flexible sample-hold circuit. Compared with that of earlier models, this display mode gives better photographic records with the base-line in simultaneous multi-trace display. Simple and systematic methods are described for designing a circuit to one's own specifications, and also for compensating for component variations.

  19. Ultrasonic Fluid Quality Sensor System

    DOEpatents

    Gomm, Tyler J.; Kraft, Nancy C.; Phelps, Larry D.; Taylor, Steven C.

    2003-10-21

    A system for determining the composition of a multiple-component fluid and for determining linear flow comprising at least one sing-around circuit that determines the velocity of a signal in the multiple-component fluid and that is correlatable to a database for the multiple-component fluid. A system for determining flow uses two of the inventive circuits, one of which is set at an angle that is not perpendicular to the direction of flow.

  20. Ultrasonic fluid quality sensor system

    DOEpatents

    Gomm, Tyler J.; Kraft, Nancy C.; Phelps, Larry D.; Taylor, Steven C.

    2002-10-08

    A system for determining the composition of a multiple-component fluid and for determining linear flow comprising at least one sing-around circuit that determines the velocity of a signal in the multiple-component fluid and that is correlatable to a database for the multiple-component fluid. A system for determining flow uses two of the inventive circuits, one of which is set at an angle that is not perpendicular to the direction of flow.

  1. 50 Years of ``Scaling'' Jack Kilby's Invention

    NASA Astrophysics Data System (ADS)

    Doering, Robert

    2008-03-01

    This year is the 50th anniversary of Jack Kilby's 1958 invention of the integrated circuit (IC), for which he won the 2000 Nobel Prize in Physics. Since that invention in a laboratory at Texas Instruments, IC components have been continuously miniaturized, which has resulted in exponential improvement trends in their performance, energy efficiency, and cost per function. These improvements have created a semiconductor industry that has grown to over 250B in annual sales. The process of reducing integrated-circuit component size and associated parameters in a coordinated fashion is traditionally called ``feature-size scaling.'' Kilby's original circuit had active (transistor) and passive (resistor, capacitor) components with dimensions of a few millimeters. Today, the minimum feature sizes on integrated circuits are less than 30 nanometers for patterned line widths and down to about one nanometer for film thicknesses. Thus, we have achieved about five orders of magnitude in linear-dimension scaling over the past fifty years, which has resulted in about ten orders of magnitude increase in the density of IC components, a representation of ``Moore's Law.'' As IC features are approaching atomic dimensions, increasing emphasis is now being given to the parallel effort of further diversifying the types of components in integrated circuits. This is called ``functional scaling'' and ``more then Moore.'' Of course, the enablers for both types of scaling have been developed at many laboratories around the world. This talk will review a few of the highlights in scaling and its applications from R&D projects at Texas Instruments.

  2. Stability analysis of an autocatalytic protein model

    NASA Astrophysics Data System (ADS)

    Lee, Julian

    2016-05-01

    A self-regulatory genetic circuit, where a protein acts as a positive regulator of its own production, is known to be the simplest biological network with a positive feedback loop. Although at least three components—DNA, RNA, and the protein—are required to form such a circuit, stability analysis of the fixed points of this self-regulatory circuit has been performed only after reducing the system to a two-component system, either by assuming a fast equilibration of the DNA component or by removing the RNA component. Here, stability of the fixed points of the three-component positive feedback loop is analyzed by obtaining eigenvalues of the full three-dimensional Hessian matrix. In addition to rigorously identifying the stable fixed points and saddle points, detailed information about the system can be obtained, such as the existence of complex eigenvalues near a fixed point.

  3. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least once...

  4. Automatic quadrature control and measuring system. [using optical coupling circuitry

    NASA Technical Reports Server (NTRS)

    Hamlet, J. F. (Inventor)

    1974-01-01

    A quadrature component cancellation and measuring system comprising a detection system for detecting the quadrature component from a primary signal, including reference circuitry to define the phase of the quadrature component for detection is described. A Raysistor optical coupling control device connects an output from the detection system to a circuit driven by a signal based upon the primary signal. Combining circuitry connects the primary signal and the circuit controlled by the Raysistor device to subtract quadrature components. A known current through the optically sensitive element produces a signal defining the magnitude of the quadrature component.

  5. Stochastic modular analysis for gene circuits: interplay among retroactivity, nonlinearity, and stochasticity.

    PubMed

    Kim, Kyung Hyuk; Sauro, Herbert M

    2015-01-01

    This chapter introduces a computational analysis method for analyzing gene circuit dynamics in terms of modules while taking into account stochasticity, system nonlinearity, and retroactivity. (1) ANALOG ELECTRICAL CIRCUIT REPRESENTATION FOR GENE CIRCUITS: A connection between two gene circuit components is often mediated by a transcription factor (TF) and the connection signal is described by the TF concentration. The TF is sequestered to its specific binding site (promoter region) and regulates downstream transcription. This sequestration has been known to affect the dynamics of the TF by increasing its response time. The downstream effect-retroactivity-has been shown to be explicitly described in an electrical circuit representation, as an input capacitance increase. We provide a brief review on this topic. (2) MODULAR DESCRIPTION OF NOISE PROPAGATION: Gene circuit signals are noisy due to the random nature of biological reactions. The noisy fluctuations in TF concentrations affect downstream regulation. Thus, noise can propagate throughout the connected system components. This can cause different circuit components to behave in a statistically dependent manner, hampering a modular analysis. Here, we show that the modular analysis is still possible at the linear noise approximation level. (3) NOISE EFFECT ON MODULE INPUT-OUTPUT RESPONSE: We investigate how to deal with a module input-output response and its noise dependency. Noise-induced phenotypes are described as an interplay between system nonlinearity and signal noise. Lastly, we provide the comprehensive approach incorporating the above three analysis methods, which we call "stochastic modular analysis." This method can provide an analysis framework for gene circuit dynamics when the nontrivial effects of retroactivity, stochasticity, and nonlinearity need to be taken into account.

  6. Acute brown adipose tissue temperature response to cold in monosodium glutamate-treated Siberian hamsters

    PubMed Central

    Leitner, Claudia; Bartness, Timothy J.

    2014-01-01

    Neonatal monosodium glutamate (MSG) administration increases adiposity, decreases energy expenditure and is associated with arcuate nucleus (Arc) destruction. Disrupted brown adipose tissue (BAT) thermogenesis underlies some of these effects, although, interscapular BAT temperature (TIBAT) has not been measured. Therefore, we tested the effects of neonatal MSG or vehicle administration in Siberian hamsters and, when they were adults, measured TIBAT during acute cold exposure. The Arc and its projection to the hypothalamic paraventricular nucleus (PVH) are both components of the CNS outflow circuits to IBAT, with the latter implicated in BAT thermogenesis that could be compromised by MSG treatment. Using a viral transneuronal tract tracer, pseudorabies virus (PRV), we also tested whether the components of these circuits were intact. As adults, MSG-treated hamsters had significantly increased body mass and some white fat pad masses, markedly reduced Arc Nissl and neuropeptide staining, and PVH neuropeptide fiber staining. Cold-exposed (18 h at 5 °C) MSG- and vehicle-treated hamsters initially maintained TIBAT, but the ability of the former waned after 2 h being significantly decreased by 18 h. PRV immunoreactive fibers/cells were not altered by neonatal MSG treatment despite substantial Arc and PVH destruction. MSG- and vehicle-treated hamsters given an exogenous norepinephrine challenge showed identical increases in the duration and peak of TIBAT. Thus, the inability of MSG-treated animals to sustain TIBAT in the cold is not due to any obvious MSG-induced deletions of central sympathetic outflow circuits to IBAT, but appears to be extrinsic to the tissue nevertheless. PMID:19643091

  7. LDRD report: Smoke effects on electrical equipment

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    TANAKA,TINA J.; BAYNES JR.,EDWARD E.; NOWLEN,STEVEN P.

    2000-03-01

    Smoke is known to cause electrical equipment failure, but the likelihood of immediate failure during a fire is unknown. Traditional failure assessment techniques measure the density of ionic contaminants deposited on surfaces to determine the need for cleaning or replacement of electronic equipment exposed to smoke. Such techniques focus on long-term effects, such as corrosion, but do not address the immediate effects of the fire. This document reports the results of tests on the immediate effects of smoke on electronic equipment. Various circuits and components were exposed to smoke from different fields in a static smoke exposure chamber and weremore » monitored throughout the exposure. Electrically, the loss of insulation resistance was the most important change caused by smoke. For direct current circuits, soot collected on high-voltage surfaces sometimes formed semi-conductive soot bridges that shorted the circuit. For high voltage alternating current circuits, the smoke also tended to increase the likelihood of arcing, but did not accumulate on the surfaces. Static random access memory chips failed for high levels of smoke, but hard disk drives did not. High humidity increased the conductive properties of the smoke. The conductivity does not increase linearly with smoke density as first proposed; however, it does increase with quantity. The data can be used to give a rough estimate of the amount of smoke that will cause failures in CMOS memory chips, dc and ac circuits. Comparisons of this data to other fire tests can be made through the optical and mass density measurements of the smoke.« less

  8. Reliability Assessment of Critical Electronic Components

    DTIC Science & Technology

    1992-07-01

    Failures FLHP - Full Horse Power FSN - Federal Stock Number I Current IC - Integrated Circuit IPB - Illustrated Parts Breakdown K - Boltzmans Constant L...Classified P - Power PC - Printed Circuit PCB - Printed Circuit Board PGA - Pin Grid Array PPM - Parts Per Million PWB - Printed Wiring Board 0...4-59 4.4.3.2.3 Circuit Brcakers ......................................................... 4-59 4.4.3.2.4 Thermal

  9. Compact Circuit Preprocesses Accelerometer Output

    NASA Technical Reports Server (NTRS)

    Bozeman, Richard J., Jr.

    1993-01-01

    Compact electronic circuit transfers dc power to, and preprocesses ac output of, accelerometer and associated preamplifier. Incorporated into accelerometer case during initial fabrication or retrofit onto commercial accelerometer. Made of commercial integrated circuits and other conventional components; made smaller by use of micrologic and surface-mount technology.

  10. Brain Magnetic Resonance Spectroscopy in Tourette's Disorder

    ERIC Educational Resources Information Center

    DeVito, Timothy J.; Drost, Dick J.; Pavlosky, William; Neufeld, Richard W.J.; Rajakumar, Nagalingam; McKinlay, B. Duncan; Williamson, Peter C.; Nicolson, Rob

    2005-01-01

    Objective: Although abnormalities of neural circuits involving the cortex, striatum, and thalamus are hypothesized to underlie Tourette's disorder, the neuronal abnormalities within components of these circuits are unknown. The purpose of this study was to examine the cellular neurochemistry within these circuits in Tourette's disorder using…

  11. A Virtual Circuits Lab

    ERIC Educational Resources Information Center

    Vick, Matthew E.

    2010-01-01

    The University of Colorado's Physics Education Technology (PhET) website offers free, high-quality simulations of many physics experiments that can be used in the classroom. The Circuit Construction Kit, for example, allows students to safely and constructively play with circuit components while learning the mathematics behind many circuit…

  12. A quantitative framework for the forward design of synthetic miRNA circuits.

    PubMed

    Bloom, Ryan J; Winkler, Sally M; Smolke, Christina D

    2014-11-01

    Synthetic genetic circuits incorporating regulatory components based on RNA interference (RNAi) have been used in a variety of systems. A comprehensive understanding of the parameters that determine the relationship between microRNA (miRNA) and target expression levels is lacking. We describe a quantitative framework supporting the forward engineering of gene circuits that incorporate RNAi-based regulatory components in mammalian cells. We developed a model that captures the quantitative relationship between miRNA and target gene expression levels as a function of parameters, including mRNA half-life and miRNA target-site number. We extended the model to synthetic circuits that incorporate protein-responsive miRNA switches and designed an optimized miRNA-based protein concentration detector circuit that noninvasively measures small changes in the nuclear concentration of β-catenin owing to induction of the Wnt signaling pathway. Our results highlight the importance of methods for guiding the quantitative design of genetic circuits to achieve robust, reliable and predictable behaviors in mammalian cells.

  13. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Marchisio, Mario Andrea, E-mail: marchisio@hit.edu.cn

    Published in 2008, Parts & Pools represents one of the first attempts to conceptualize the modular design of bacterial synthetic gene circuits with Standard Biological Parts (DNA segments) and Pools of molecules referred to as common signal carriers (e.g., RNA polymerases and ribosomes). The original framework for modeling bacterial components and designing prokaryotic circuits evolved over the last years and brought, first, to the development of an algorithm for the automatic design of Boolean gene circuits. This is a remarkable achievement since gene digital circuits have a broad range of applications that goes from biosensors for health and environment caremore » to computational devices. More recently, Parts & Pools was enabled to give a proper formal description of eukaryotic biological circuit components. This was possible by employing a rule-based modeling approach, a technique that permits a faithful calculation of all the species and reactions involved in complex systems such as eukaryotic cells and compartments. In this way, Parts & Pools is currently suitable for the visual and modular design of synthetic gene circuits in yeast and mammalian cells too.« less

  14. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Sousa, Francisco F. G. de; Rubinger, Rero M.; Sartorelli, José C., E-mail: sartorelli@if.usp.br

    We report high-resolution measurements that experimentally confirm a spiral cascade structure and a scaling relationship of shrimps in the Chua's circuit. Circuits constructed using this component allow for a comprehensive characterization of the circuit behaviors through high resolution parameter spaces. To illustrate the power of our technological development for the creation and the study of chaotic circuits, we constructed a Chua circuit and study its high resolution parameter space. The reliability and stability of the designed component allowed us to obtain data for long periods of time (∼21 weeks), a data set from which an accurate estimation of Lyapunov exponentsmore » for the circuit characterization was possible. Moreover, this data, rigorously characterized by the Lyapunov exponents, allows us to reassure experimentally that the shrimps, stable islands embedded in a domain of chaos in the parameter spaces, can be observed in the laboratory. Finally, we confirm that their sizes decay exponentially with the period of the attractor, a result expected to be found in maps of the quadratic family.« less

  15. Spacecraft high-voltage power supply construction

    NASA Technical Reports Server (NTRS)

    Sutton, J. F.; Stern, J. E.

    1975-01-01

    The design techniques, circuit components, fabrication techniques, and past experience used in successful high-voltage power supplies for spacecraft flight systems are described. A discussion of the basic physics of electrical discharges in gases is included and a design rationale for the prevention of electrical discharges is provided. Also included are typical examples of proven spacecraft high-voltage power supplies with typical specifications for design, fabrication, and testing.

  16. Design, experiments and simulation of voltage transformers on the basis of a differential input D-dot sensor.

    PubMed

    Wang, Jingang; Gao, Can; Yang, Jie

    2014-07-17

    Currently available traditional electromagnetic voltage sensors fail to meet the measurement requirements of the smart grid, because of low accuracy in the static and dynamic ranges and the occurrence of ferromagnetic resonance attributed to overvoltage and output short circuit. This work develops a new non-contact high-bandwidth voltage measurement system for power equipment. This system aims at the miniaturization and non-contact measurement of the smart grid. After traditional D-dot voltage probe analysis, an improved method is proposed. For the sensor to work in a self-integrating pattern, the differential input pattern is adopted for circuit design, and grounding is removed. To prove the structure design, circuit component parameters, and insulation characteristics, Ansoft Maxwell software is used for the simulation. Moreover, the new probe was tested on a 10 kV high-voltage test platform for steady-state error and transient behavior. Experimental results ascertain that the root mean square values of measured voltage are precise and that the phase error is small. The D-dot voltage sensor not only meets the requirement of high accuracy but also exhibits satisfactory transient response. This sensor can meet the intelligence, miniaturization, and convenience requirements of the smart grid.

  17. Influence of Gap Distance on Vacuum Arc Characteristics of Cup Type AMF Electrode in Vacuum Interrupters

    NASA Astrophysics Data System (ADS)

    Cheng, Shaoyong; Xiu, Shixin; Wang, Jimei; Shen, Zhengchao

    2006-11-01

    The greenhouse effect of SF6 is a great concern today. The development of high voltage vacuum circuit breakers becomes more important. The vacuum circuit breaker has minimum pollution to the environment. The vacuum interrupter is the key part of a vacuum circuit breaker. The interrupting characteristics in vacuum and arc-controlling technique are the main problems to be solved for a longer gap distance in developing high voltage vacuum interrupters. To understand the vacuum arc characteristics and provide effective technique to control vacuum arc in a long gap distance, the arc mode transition of a cup-type axial magnetic field electrode is observed by a high-speed charge coupled device (CCD) video camera under different gap distances while the arc voltage and arc current are recorded. The controlling ability of the axial magnetic field on vacuum arc obviously decreases when the gap distance is longer than 40 mm. The noise components and mean value of the arc voltage significantly increase. The effective method for controlling the vacuum arc characteristics is provided by long gap distances based on the test results. The test results can be used as a reference to develop high voltage and large capacity vacuum interrupters.

  18. Development, Integration and Testing of Automated Triggering Circuit for Hybrid DC Circuit Breaker

    NASA Astrophysics Data System (ADS)

    Kanabar, Deven; Roy, Swati; Dodiya, Chiragkumar; Pradhan, Subrata

    2017-04-01

    A novel concept of Hybrid DC circuit breaker having combination of mechanical switch and static switch provides arc-less current commutation into the dump resistor during quench in superconducting magnet operation. The triggering of mechanical and static switches in Hybrid DC breaker can be automatized which can effectively reduce the overall current commutation time of hybrid DC circuit breaker and make the operation independent of opening time of mechanical switch. With this view, a dedicated control circuit (auto-triggering circuit) has been developed which can decide the timing and pulse duration for mechanical switch as well as static switch from the operating parameters. This circuit has been tested with dummy parameters and thereafter integrated with the actual test set up of hybrid DC circuit breaker. This paper deals with the conceptual design of the auto-triggering circuit, its control logic and operation. The test results of Hybrid DC circuit breaker using this circuit have also been discussed.

  19. Failure analysis of pinch-torsion tests as a thermal runaway risk evaluation method of Li-Ion Cells

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Xia, Yuzhi; Li, Dr. Tianlei; Ren, Prof. Fei

    2014-01-01

    Recently a pinch-torsion test is developed for safety testing of Li-ion batteries (Ren et al., J. Power Source, 2013). It has been demonstrated that this test can generate small internal short-circuit spots in the separator in a controllable and repeatable manner. In the current research, the failure mechanism is examined by numerical simulations and comparisons to experimental observations. Finite element models are developed to evaluate the deformation of the separators under both pure pinch and pinch-torsion loading conditions. It is discovered that the addition of the torsion component significantly increased the maximum principal strain, which is believed to induce themore » internal short circuit. In addition, the applied load in the pinch-torsion test is significantly less than in the pure pinch test, thus dramatically improving the applicability of this method to ultra-thick batteries which otherwise require heavy load in excess of machine capability. It is further found that the separator failure is achieved in the early stage of torsion (within a few degree of rotation). Effect of coefficient of friction on the maximum principal strain is also examined.« less

  20. Dopaminergic stimulation in unilateral neglect

    PubMed Central

    Geminiani, G.; Bottini, G.; Sterzi, R.

    1998-01-01

    OBJECTIVE—To explore the hypothesis that dopaminergic circuits play a part in the premotor components of the unilateral neglect syndrome, the effects of acute dopaminergic stimulation in patients with neglect were studied.
METHODS—Two tasks were evaluated before and after subcutaneous administration of apomorphine and placebo: a circle crossing test and a test of target exploration (a modified version of the bell test), performed both in perceptual (counting) and in perceptual-motor (pointing) conditions.
SUBJECTS—Four patients with left neglect.
RESULTS—After dopaminergic stimulation, a significant improvement was found compared with placebo administration and baseline evaluation, in the performance of the two tests. Three of the patients had a more marked improvement in the perceptual-motor condition (pointing) of the task than the perceptual condition (counting).
CONCLUSIONS—The findings suggest that dopaminergic neuronal networks may mediate, in different ways, both perceptive and premotor components of the unilateral neglect syndrome. 

 PMID:9728946

  1. Effect of shielding gas composition on the properties of hyperbaric GMA welds in duplex steels

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Ware, N.; Dos Santos, J.F.; Richardson, I.

    1994-12-31

    By using Ar/He based shielding gas mixtures with a variety of oxygen and nitrogen additions the absorption of active gas components into duplex stainless steels welded under hyperbaric conditions was examined. The pressure levels used corresponded to seawater depths of 100m, 200m and 300m. The GMAW process in the short circuit transfer mode was used for all tests. Both bead-on-plate and ``V`` butt joints were carried out. The effect of variations in the weld metal active gas components on the weld metal chemical composition and phase balance was investigated. In a second set of tests the effect of varying heatmore » inputs on the phase balance and microstructure was assessed.« less

  2. Demonstration of Inexact Computing Implemented in the JPEG Compression Algorithm using Probabilistic Boolean Logic applied to CMOS Components

    DTIC Science & Technology

    2015-12-24

    Signal to Noise Ratio SPICE Simulation Program with Integrated Circuit Emphasis TIFF Tagged Image File Format USC University of Southern California xvii...sources can create errors in digital circuits. These effects can be simulated using Simulation Program with Integrated Circuit Emphasis ( SPICE ) or...compute summary statistics. 4.1 Circuit Simulations Noisy analog circuits can be simulated in SPICE or Cadence SpectreTM software via noisy voltage

  3. Measurements by a Vector Network Analyzer at 325 to 508 GHz

    NASA Technical Reports Server (NTRS)

    Fung, King Man; Samoska, Lorene; Chattopadhyay, Goutam; Gaier, Todd; Kangaslahti, Pekka; Pukala, David; Lau, Yuenie; Oleson, Charles; Denning, Anthony

    2008-01-01

    Recent experiments were performed in which return loss and insertion loss of waveguide test assemblies in the frequency range from 325 to 508 GHz were measured by use of a swept-frequency two-port vector network analyzer (VNA) test set. The experiments were part of a continuing effort to develop means of characterizing passive and active electronic components and systems operating at ever increasing frequencies. The waveguide test assemblies comprised WR-2.2 end sections collinear with WR-3.3 middle sections. The test set, assembled from commercially available components, included a 50-GHz VNA scattering- parameter test set and external signal synthesizers, augmented with recently developed frequency extenders, and further augmented with attenuators and amplifiers as needed to adjust radiofrequency and intermediate-frequency power levels between the aforementioned components. The tests included line-reflect-line calibration procedures, using WR-2.2 waveguide shims as the "line" standards and waveguide flange short circuits as the "reflect" standards. Calibrated dynamic ranges somewhat greater than about 20 dB for return loss and 35 dB for insertion loss were achieved. The measurement data of the test assemblies were found to substantially agree with results of computational simulations.

  4. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be... of this section, a cut-out circuit is any circuit which overrides the operation of automatic warning...

  5. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be... of this section, a cut-out circuit is any circuit which overrides the operation of automatic warning...

  6. Negative Difference Resistance and Its Application to Construct Boolean Logic Circuits

    NASA Astrophysics Data System (ADS)

    Nikodem, Maciej; Bawiec, Marek A.; Surmacz, Tomasz R.

    Electronic circuits based on nanodevices and quantum effect are the future of logic circuits design. Today's technology allows constructing resonant tunneling diodes, quantum cellular automata and nanowires/nanoribbons that are the elementary components of threshold gates. However, synthesizing a threshold circuit for an arbitrary logic function is still a challenging task where no efficient algorithms exist. This paper focuses on Generalised Threshold Gates (GTG), giving the overview of threshold circuit synthesis methods and presenting an algorithm that considerably simplifies the task in case of GTG circuits.

  7. Mapleson's Breathing Systems.

    PubMed

    Kaul, Tej K; Mittal, Geeta

    2013-09-01

    Mapleson breathing systems are used for delivering oxygen and anaesthetic agents and to eliminate carbon dioxide during anaesthesia. They consist of different components: Fresh gas flow, reservoir bag, breathing tubes, expiratory valve, and patient connection. There are five basic types of Mapleson system: A, B, C, D and E depending upon the different arrangements of these components. Mapleson F was added later. For adults, Mapleson A is the circuit of choice for spontaneous respiration where as Mapleson D and its Bains modifications are best available circuits for controlled ventilation. For neonates and paediatric patients Mapleson E and F (Jackson Rees modification) are the best circuits. In this review article, we will discuss the structure of the circuits and functional analysis of various types of Mapleson systems and their advantages and disadvantages.

  8. Membrane oxygenator heat exchanger failure detected by unique blood gas findings.

    PubMed

    Hawkins, Justin L

    2014-03-01

    Failure of components integrated into the cardiopulmonary bypass circuit, although rare, can bring about catastrophic results. One of these components is the heat exchanger of the membrane oxygenator. In this compartment, unsterile water from the heater cooler device is separated from the sterile blood by stainless steel, aluminum, or by polyurethane. These areas are glued or welded to keep the two compartments separate, maintaining sterility of the blood. Although quality control testing is performed by the manufacturer at the factory level, transport presents the real possibility for damage. Because of this, each manufacturer has included in the instructions for use a testing procedure for testing the integrity of the heat exchanger component. Water is circulated through the heat exchanger before priming and a visible check is made of the oxygenator bundle to check for leaks. If none are apparent, then priming of the oxygenator is performed. In this particular case, this procedure was not useful in detecting communication between the water and blood chambers of the oxygenator.

  9. Electrical short circuit and current overload tests on aircraft wiring

    NASA Technical Reports Server (NTRS)

    Cahill, Patricia

    1995-01-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  10. Built-in-test by signature inspection (bitsi)

    DOEpatents

    Bergeson, Gary C.; Morneau, Richard A.

    1991-01-01

    A system and method for fault detection for electronic circuits. A stimulus generator sends a signal to the input of the circuit under test. Signature inspection logic compares the resultant signal from test nodes on the circuit to an expected signal. If the signals do not match, the signature inspection logic sends a signal to the control logic for indication of fault detection in the circuit. A data input multiplexer between the test nodes of the circuit under test and the signature inspection logic can provide for identification of the specific node at fault by the signature inspection logic. Control logic responsive to the signature inspection logic conveys information about fault detection for use in determining the condition of the circuit. When used in conjunction with a system test controller, the built-in test by signature inspection system and method can be used to poll a plurality of circuits automatically and continuous for faults and record the results of such polling in the system test controller.

  11. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200 liters...

  12. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200 liters...

  13. Integrated testing system FiTest for diagnosis of PCBA

    NASA Astrophysics Data System (ADS)

    Bogdan, Arkadiusz; Lesniak, Adam

    2016-12-01

    This article presents the innovative integrated testing system FiTest for automatic, quick inspection of printed circuit board assemblies (PCBA) manufactured in Surface Mount Technology (SMT). Integration of Automatic Optical Inspection (AOI), In-Circuit Tests (ICT) and Functional Circuit Tests (FCT) resulted in universal hardware platform for testing variety of electronic circuits. The platform provides increased test coverage, decreased level of false calls and optimization of test duration. The platform is equipped with powerful algorithms performing tests in a stable and repetitive way and providing effective management of diagnosis.

  14. NSTX Electrical Power Systems

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    A. Ilic; E. Baker; R. Hatcher

    The National Spherical Torus Experiment (NSTX) has been designed and installed in the existing facilities at Princeton Plasma Physic Laboratory (PPPL). Most of the hardware, plant facilities, auxiliary sub-systems, and power systems originally used for the Tokamak Fusion Test Reactor (TFTR) have been used with suitable modifications to reflect NSTX needs. The design of the NSTX electrical power system was tailored to suit the available infrastructure and electrical equipment on site. Components were analyzed to verify their suitability for use in NSTX. The total number of circuits and the location of the NSTX device drove the major changes in themore » Power system hardware. The NSTX has eleven (11) circuits to be fed as compared to the basic three power loops for TFTR. This required changes in cabling to insure that each cable tray system has the positive and negative leg of cables in the same tray. Also additional power cabling had to be installed to the new location. The hardware had to b e modified to address the need for eleven power loops. Power converters had to be reconnected and controlled in anti-parallel mode for the Ohmic heating and two of the Poloidal Field circuits. The circuit for the Coaxial Helicity Injection (CHI) System had to be carefully developed to meet this special application. Additional Protection devices were designed and installed for the magnet coils and the CHI. The thrust was to making the changes in the most cost-effective manner without compromising technical requirements. This paper describes the changes and addition to the Electrical Power System components for the NSTX magnet systems.« less

  15. Efforts to Reduce International Space Station Crew Maintenance Time in the Management of the Extravehicular Mobility Unit Transport Loop Water Quality

    NASA Technical Reports Server (NTRS)

    Etter,David; Rector, Tony; Boyle, robert; Zande, Chris Vande

    2012-01-01

    The EMU (Extravehicular Mobility Unit) contains a semi-closed-loop re-circulating water circuit (Transport Loop) to absorb heat into a LCVG (Liquid Coolant and Ventilation Garment) worn by the astronaut. A second, single-pass water circuit (Feed-water Loop) provides water to a cooling device (Sublimator) containing porous plates, and that water sublimates through the porous plates to space vacuum. The cooling effect from the sublimation of this water translates to a cooling of the LCVG water that circulates through the Sublimator. The quality of the EMU Transport Loop water is maintained through the use of a water processing kit (ALCLR - Airlock Cooling Loop Remediation) that is used to periodically clean and disinfect the water circuit. Opportunities to reduce crew time associated with ALCLR operations include a detailed review of the historical water quality data for evidence to support an extension to the implementation cycle. Furthermore, an EMU returned after 2-years of use on the ISS (International Space Station) is being used as a test bed to evaluate the results of extended and repeated ALCLR implementation cycles. Finally, design, use and on-orbit location enhancements to the ALCLR kit components are being considered to allow the implementation cycle to occur in parallel with other EMU maintenance and check-out activities, and to extend the life of the ALCLR kit components. These efforts are undertaken to reduce the crew-time and logistics burdens for the EMU, while ensuring the long-term health of the EMU water circuits for a post- Shuttle 6-year service life.

  16. Efforts to Reduce International Space Station Crew Maintenance for the Management of the Extravehicular Mobility Unit Transport Loop Water Quality

    NASA Technical Reports Server (NTRS)

    Steele, John W.; Etter, David; Rector, Tony; Boyle, Robert; Vandezande, Christopher

    2013-01-01

    The EMU (Extravehicular Mobility Unit) contains a semi-closed-loop re-circulating water circuit (Transport Loop) to absorb heat into a LCVG (Liquid Coolant and Ventilation Garment) worn by the astronaut. A second, single-pass water circuit (Feed-water Loop) provides water to a cooling device (Sublimator) containing porous plates, and that water sublimates through the porous plates to space vacuum. The cooling effect from the sublimation of this water translates to a cooling of the LCVG water that circulates through the Sublimator. The quality of the EMU Transport Loop water is maintained through the use of a water processing kit (ALCLR Airlock Cooling Loop Remediation) that is used to periodically clean and disinfect the water circuit. Opportunities to reduce crew time associated with on-orbit ALCLR operations include a detailed review of the historical water quality data for evidence to support an extension to the implementation cycle. Furthermore, an EMU returned after 2-years of use on the ISS (International Space Station) is being used as a test bed to evaluate the results of extended and repeated ALCLR implementation cycles. Finally, design, use and on-orbit location enhancements to the ALCLR kit components are being considered to allow the implementation cycle to occur in parallel with other EMU maintenance and check-out activities, and to extend the life of the ALCLR kit components. These efforts are undertaken to reduce the crew-time and logistics burdens for the EMU, while ensuring the long-term health of the EMU water circuits for a post-Shuttle 6-year service life.

  17. Advances in integrated photonic circuits for packet-switched interconnection

    NASA Astrophysics Data System (ADS)

    Williams, Kevin A.; Stabile, Ripalta

    2014-03-01

    Sustained increases in capacity and connectivity are needed to overcome congestion in a range of broadband communication network nodes. Packet routing and switching in the electronic domain are leading to unsustainable energy- and bandwidth-densities, motivating research into hybrid solutions: optical switching engines are introduced for massive-bandwidth data transport while the electronic domain is clocked at more modest GHz rates to manage routing. Commercially-deployed optical switching engines using MEMS technologies are unwieldy and too slow to reconfigure for future packet-based networking. Optoelectronic packet-compliant switch technologies have been demonstrated as laboratory prototypes, but they have so far mostly used discretely pigtailed components, which are impractical for control plane development and product assembly. Integrated photonics has long held the promise of reduced hardware complexity and may be the critical step towards packet-compliant optical switching engines. Recently a number of laboratories world-wide have prototyped optical switching circuits using monolithic integration technology with up to several hundreds of integrated optical components per chip. Our own work has focused on multi-input to multi-output switching matrices. Recently we have demonstrated 8×8×8λ space and wavelength selective switches using gated cyclic routers and 16×16 broadband switching chips using monolithic multi-stage networks. We now operate these advanced circuits with custom control planes implemented with FPGAs to explore real time packet routing in multi-wavelength, multi-port test-beds. We review our contributions in the context of state of the art photonic integrated circuit technology and packet optical switching hardware demonstrations.

  18. First-year university Physics students’ knowledge about direct current circuits: probing improvement in understanding as a function of teaching and learning interventions

    NASA Astrophysics Data System (ADS)

    Newman, Richard; van der Ventel, Brandon; Hanekom, Crischelle

    2017-07-01

    Probing university students’ understanding of direct-current (DC) resistive circuits is still a field of active physics education research. We report here on a study we conducted of this understanding, where the cohort consisted of students in a large-enrollment first-year physics module. This is a non-calculus based physics module for students in the life sciences stream. The study involved 366 students enrolled in the physics (bio) 154 module at Stellenbosch University in 2015. Students’ understanding of DC resistive circuits was probed by means of a standardized test instrument. The instrument comprises 29 multiple choice questions that students have to answer in ~40 min. Students were required to first complete the standardized test at the start of semester (July 2015). For ease of reference we call this test the pre-test. Students answered the pre-test having no university-level formal exposure to DC circuits in theory or practice. The pre-test therefore served to probe students’ school level knowledge of DC circuits. As the semester progressed students were exposed to a practical (E1), lectures, a prescribed textbook, a tutorial and online videos focusing on DC circuits. The E1 practical required students to solve DC circuit problems by means of physically constructing circuits, algebraically using Kirchhoff's Rules and Ohm’s Law, and by means of simulating circuits using the app iCircuit running on iPads (iOS platform). Each E1 practical involved ~50 students in a three hour session. The practical was repeated three afternoons per week over an eight week period. Twenty three iPads were distributed among students on a practical afternoon in order for them to do the circuit simulations in groups (of 4-5 students). At the end of the practical students were again required to do the standardized test on circuits and complete a survey on their experience of the use of the iPad and iCircuit app. For ease of reference we refer to this second test as the post-test. The students’ average score on the post-test was found to be ~25% higher than their pre-test score. The results of the iPad use survey show that the majority of students felt that the iCircuit app enhanced their learning of DC circuits.

  19. Module Eleven: Capacitance; Basic Electricity and Electronics Individualized Learning System.

    ERIC Educational Resources Information Center

    Bureau of Naval Personnel, Washington, DC.

    In this module the student will learn about another circuit quantity, capacitance, and discover the effects of this component on circuit current, voltage, and power. The module is divided into seven lessons: the capacitor, theory of capacitance, total capacitance, RC (resistive-capacitive circuit) time constant, capacitive reactance, phase and…

  20. Towards programmable plant genetic circuits.

    PubMed

    Medford, June I; Prasad, Ashok

    2016-07-01

    Synthetic biology enables the construction of genetic circuits with predictable gene functions in plants. Detailed quantitative descriptions of the transfer function or input-output function for genetic parts (promoters, 5' and 3' untranslated regions, etc.) are collected. These data are then used in computational simulations to determine their robustness and desired properties, thereby enabling the best components to be selected for experimental testing in plants. In addition, the process forms an iterative workflow which allows vast improvement to validated elements with sub-optimal function. These processes enable computational functions such as digital logic in living plants and follow the pathway of technological advances which took us from vacuum tubes to cell phones. © 2016 The Authors The Plant Journal © 2016 John Wiley & Sons Ltd.

  1. Current-mode subthreshold MOS implementation of the Herault-Jutten autoadaptive network

    NASA Astrophysics Data System (ADS)

    Cohen, Marc H.; Andreou, Andreas G.

    1992-05-01

    The translinear circuits in subthreshold MOS technology and current-mode design techniques for the implementation of neuromorphic analog network processing are investigated. The architecture, also known as the Herault-Jutten network, performs an independent component analysis and is essentially a continuous-time recursive linear adaptive filter. Analog I/O interface, weight coefficients, and adaptation blocks are all integrated on the chip. A small network with six neurons and 30 synapses was fabricated in a 2-microns n-well double-polysilicon, double-metal CMOS process. Circuit designs at the transistor level yield area-efficient implementations for neurons, synapses, and the adaptation blocks. The design methodology and constraints as well as test results from the fabricated chips are discussed.

  2. Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics

    DOEpatents

    Rogers, John A; Meitl, Matthew; Sun, Yugang; Ko, Heung Cho; Carlson, Andrew; Choi, Won Mook; Stoykovich, Mark; Jiang, Hanqing; Huang, Yonggang; Nuzzo, Ralph G; Zhu, Zhengtao; Menard, Etienne; Khang, Dahl-Young

    2014-05-20

    In an aspect, the present invention provides stretchable, and optionally printable, components such as semiconductors and electronic circuits capable of providing good performance when stretched, compressed, flexed or otherwise deformed, and related methods of making or tuning such stretchable components. Stretchable semiconductors and electronic circuits preferred for some applications are flexible, in addition to being stretchable, and thus are capable of significant elongation, flexing, bending or other deformation along one or more axes. Further, stretchable semiconductors and electronic circuits of the present invention are adapted to a wide range of device configurations to provide fully flexible electronic and optoelectronic devices.

  3. Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics

    DOEpatents

    Rogers, John A [Champaign, IL; Meitl, Matthew [Raleigh, NC; Sun, Yugang [Naperville, IL; Ko, Heung Cho [Urbana, IL; Carlson, Andrew [Urbana, IL; Choi, Won Mook [Champaign, IL; Stoykovich, Mark [Dover, NH; Jiang, Hanqing [Urbana, IL; Huang, Yonggang [Glencoe, IL; Nuzzo, Ralph G [Champaign, IL; Lee, Keon Jae [Tokyo, JP; Zhu, Zhengtao [Rapid City, SD; Menard, Etienne [Durham, NC; Khang, Dahl-Young [Seoul, KR; Kan, Seong Jun [Daejeon, KR; Ahn, Jong Hyun [Suwon, KR; Kim, Hoon-sik [Champaign, IL

    2012-07-10

    In an aspect, the present invention provides stretchable, and optionally printable, components such as semiconductors and electronic circuits capable of providing good performance when stretched, compressed, flexed or otherwise deformed, and related methods of making or tuning such stretchable components. Stretchable semiconductors and electronic circuits preferred for some applications are flexible, in addition to being stretchable, and thus are capable of significant elongation, flexing, bending or other deformation along one or more axes. Further, stretchable semiconductors and electronic circuits of the present invention are adapted to a wide range of device configurations to provide fully flexible electronic and optoelectronic devices.

  4. AMPLITUDE DISCRIMINATOR HAVING SEPARATE TRIGGERING AND RECOVERY CONTROLS UTILIZING AUTOMATIC TRIGGERING

    DOEpatents

    Chase, R.L.

    1962-01-23

    A transistorized amplitude discriminator circuit is described in which the initial triggering sensitivity and the recovery threshold are separately adjustable in a convenient manner. The discriminator is provided with two independent bias components, one of which is for circuit hysteresis (recovery) and one of which is for trigger threshold level. A switching circuit is provided to remove the second bias component upon activation of the trigger so that the recovery threshold is always at the point where the trailing edge of the input signal pulse goes through zero or other desired value. (AEC)

  5. Gated integrator with signal baseline subtraction

    DOEpatents

    Wang, X.

    1996-12-17

    An ultrafast, high precision gated integrator includes an opamp having differential inputs. A signal to be integrated is applied to one of the differential inputs through a first input network, and a signal indicative of the DC offset component of the signal to be integrated is applied to the other of the differential inputs through a second input network. A pair of electronic switches in the first and second input networks define an integrating period when they are closed. The first and second input networks are substantially symmetrically constructed of matched components so that error components introduced by the electronic switches appear symmetrically in both input circuits and, hence, are nullified by the common mode rejection of the integrating opamp. The signal indicative of the DC offset component is provided by a sample and hold circuit actuated as the integrating period begins. The symmetrical configuration of the integrating circuit improves accuracy and speed by balancing out common mode errors, by permitting the use of high speed switching elements and high speed opamps and by permitting the use of a small integrating time constant. The sample and hold circuit substantially eliminates the error caused by the input signal baseline offset during a single integrating window. 5 figs.

  6. Gated integrator with signal baseline subtraction

    DOEpatents

    Wang, Xucheng

    1996-01-01

    An ultrafast, high precision gated integrator includes an opamp having differential inputs. A signal to be integrated is applied to one of the differential inputs through a first input network, and a signal indicative of the DC offset component of the signal to be integrated is applied to the other of the differential inputs through a second input network. A pair of electronic switches in the first and second input networks define an integrating period when they are closed. The first and second input networks are substantially symmetrically constructed of matched components so that error components introduced by the electronic switches appear symmetrically in both input circuits and, hence, are nullified by the common mode rejection of the integrating opamp. The signal indicative of the DC offset component is provided by a sample and hold circuit actuated as the integrating period begins. The symmetrical configuration of the integrating circuit improves accuracy and speed by balancing out common mode errors, by permitting the use of high speed switching elements and high speed opamps and by permitting the use of a small integrating time constant. The sample and hold circuit substantially eliminates the error caused by the input signal baseline offset during a single integrating window.

  7. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits...

  8. Electronic Circuit Analysis Language (ECAL)

    NASA Astrophysics Data System (ADS)

    Chenghang, C.

    1983-03-01

    The computer aided design technique is an important development in computer applications and it is an important component of computer science. The special language for electronic circuit analysis is the foundation of computer aided design or computer aided circuit analysis (abbreviated as CACD and CACA) of simulated circuits. Electronic circuit analysis language (ECAL) is a comparatively simple and easy to use circuit analysis special language which uses the FORTRAN language to carry out the explanatory executions. It is capable of conducting dc analysis, ac analysis, and transient analysis of a circuit. Futhermore, the results of the dc analysis can be used directly as the initial conditions for the ac and transient analyses.

  9. Circuit design of an EMCCD camera

    NASA Astrophysics Data System (ADS)

    Li, Binhua; Song, Qian; Jin, Jianhui; He, Chun

    2012-07-01

    EMCCDs have been used in the astronomical observations in many ways. Recently we develop a camera using an EMCCD TX285. The CCD chip is cooled to -100°C in an LN2 dewar. The camera controller consists of a driving board, a control board and a temperature control board. Power supplies and driving clocks of the CCD are provided by the driving board, the timing generator is located in the control board. The timing generator and an embedded Nios II CPU are implemented in an FPGA. Moreover the ADC and the data transfer circuit are also in the control board, and controlled by the FPGA. The data transfer between the image workstation and the camera is done through a Camera Link frame grabber. The software of image acquisition is built using VC++ and Sapera LT. This paper describes the camera structure, the main components and circuit design for video signal processing channel, clock driver, FPGA and Camera Link interfaces, temperature metering and control system. Some testing results are presented.

  10. A rapid, maskless 3D prototyping for fabrication of capillary circuits: Toward urinary protein detection.

    PubMed

    Yan, Sheng; Zhu, Yuanqing; Tang, Shi-Yang; Li, Yuxing; Zhao, Qianbin; Yuan, Dan; Yun, Guolin; Zhang, Jun; Zhang, Shiwu; Li, Weihua

    2018-04-01

    Proteinuria is an established risk marker for progressive renal function loss and patients would significantly benefit from a point-of-care testing. Although extensive work has been done to develop the microfluidic devices for the detection of urinary protein, they need the complicated operation and bulky peripherals. Here, we present a rapid, maskless 3D prototyping for fabrication of capillary fluidic circuits using laser engraving. The capillary circuits can be fabricated in a short amount of time (<10 min) without the requirements of clean-room facilities and photomasks. The advanced capillary components (e.g., trigger valves, retention valves and retention bursting valves) were fabricated, enabling the sequential liquid delivery and sample-reagent mixing. With the integration of smartphone-based detection platform, the microfluidic device can quantify the urinary protein via a colorimetric analysis. By eliminating the bulky and expensive equipment, this smartphone-based detection platform is portable for on-site quantitative detection. © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  11. A miniature transformer/dc-dc converter for implantable medical devices

    NASA Astrophysics Data System (ADS)

    Mohammed, Osama A.; Jones, W. Kinzy

    1988-11-01

    This paper presents a new technique for the design of a miniature dc-dc converter used in energy producing implantable devices such as defibrillators and advanced pacemakers. This converter is inserted in such a device and is used to boost the voltage from a low voltage implanted battery to high voltage energy storage capacitors in a short period of time. The stored energy is then delivered, when needed, through an energy delivery circuit in order to stimulate or defibrillate the heart. The converter takes the form of a flyback topology which includes a miniature transformer and a specialized control circuit. The transformer was designed using a new numerical synthesis method which utilizes finite elements and dynamic programming for predicting the geometries of the transformer's magnetic circuit. The final transformer design satisfied the performance criteria and provided means for selecting the converter components. The obtained performance results for the transformer and the dc-dc converter were in excellent agreement with laboratory performance tests.

  12. Experimental equipment for measuring physical properties of the annular hydrostatic thrust bearing

    NASA Astrophysics Data System (ADS)

    Kozdera, Michal; Drábková, Sylva; Bojko, Marian

    2014-03-01

    The hydraulic circuit, through which the mineral oil is brought, is an important part of hydrostatic bearings. The annular hydrostatic thrust bearing consists of two sliding plates divided by a layer of mineral oil. In the lower plate, there are oil grooves which distribute the liquid between the sliding areas. The hydraulic circuit is made of two basic parts: the energy source and the controlling part. The hydraulic pump, which brings the liquid into the sliding bearing, is the source of the pressure energy. The sliding bearing is weighted down by axial force, which can be changed during the process. That's why in front of the particular oil grooves control components adjusting pressure and flow size are located. This paper deals with a project of a hydraulic circuit for regulation of fluid layer in the annular hydrostatic thrust bearing and the testing equipment for measuring its physical properties. It will include the issue of measuring loading capacity and height of the fluid layer in the annular hydrostatic thrust bearing.

  13. Free-Standing Organic Transistors and Circuits with Sub-Micron Thicknesses

    PubMed Central

    Fukuda, Kenjiro; Sekine, Tomohito; Shiwaku, Rei; Morimoto, Takuya; Kumaki, Daisuke; Tokito, Shizuo

    2016-01-01

    The realization of wearable electronic devices with extremely thin and flexible form factors has been a major technological challenge. While substrates typically limit the thickness of thin-film electronic devices, they are usually necessary for their fabrication and functionality. Here we report on ultra-thin organic transistors and integrated circuits using device components whose substrates that have been removed. The fabricated organic circuits with total device thicknesses down to 350 nm have electrical performance levels close to those fabricated on conventional flexible substrates. Moreover, they exhibit excellent mechanical robustness, whereby their static and dynamic electrical characteristics do not change even under 50% compressive strain. Tests using systematically applied compressive strains reveal that these free-standing organic transistors possess anisotropic mechanical stability, and a strain model for a multilayer stack can be used to describe the strain in this sort of ultra-thin device. These results show the feasibility of ultimate-thin organic electronic devices using free-standing constructions. PMID:27278828

  14. Results and Insights on the Impact of Smoke on Digital Instrumentation and Control

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Tanaka, T. J.; Nowlen, S. P.

    2001-01-31

    Smoke can cause interruptions and upsets in active electronics. Because nuclear power plants are replacing analog with digital instrumentation and control systems, qualification guidelines for new systems are being reviewed for severe environments such as smoke and electromagnetic interference. Active digital systems, individual components, and active circuits have been exposed to smoke in a program sponsored by the U.S. Nuclear Regulatory Commission. The circuits and systems were all monitored during the smoke exposure, indicating any immediate effects of the smoke. The major effect of smoke has been to increase leakage currents (through circuit bridging across contacts and leads) and tomore » cause momentary upsets and failures in digital systems. This report summarizes two previous reports and presents new results from conformal coating, memory chip, and hard drive tests. The report describes practices for mitigation of smoke damage through digital system design, fire barriers, ventilation, fire suppressants, and post fire procedures.« less

  15. Flexible organic TFT bio-signal amplifier using reliable chip component assembly process with conductive adhesive.

    PubMed

    Yoshimoto, Shusuke; Uemura, Takafumi; Akiyama, Mihoko; Ihara, Yoshihiro; Otake, Satoshi; Fujii, Tomoharu; Araki, Teppei; Sekitani, Tsuyoshi

    2017-07-01

    This paper presents a flexible organic thin-film transistor (OTFT) amplifier for bio-signal monitoring and presents the chip component assembly process. Using a conductive adhesive and a chip mounter, the chip components are mounted on a flexible film substrate, which has OTFT circuits. This study first investigates the assembly technique reliability for chip components on the flexible substrate. This study also specifically examines heart pulse wave monitoring conducted using the proposed flexible amplifier circuit and a flexible piezoelectric film. We connected the amplifier to a bluetooth device for a wearable device demonstration.

  16. Nulling Hall-Effect Current-Measuring Circuit

    NASA Technical Reports Server (NTRS)

    Sullender, Craig C.; Vazquez, Juan M.; Berru, Robert I.

    1993-01-01

    Circuit measures electrical current via combination of Hall-effect-sensing and magnetic-field-nulling techniques. Known current generated by feedback circuit adjusted until it causes cancellation or near cancellation of magnetic field produced in toroidal ferrite core by current measured. Remaining magnetic field measured by Hall-effect sensor. Circuit puts out analog signal and digital signal proportional to current measured. Accuracy of measurement does not depend on linearity of sensing components.

  17. Management of Microcircuit Obsolescence in a Pre-Production ACAT-ID Missile Program

    DTIC Science & Technology

    2002-12-01

    and Engineering Center ASIC Application Specific Integrated Circuit AVCOM Avionics Component Obsolescence Management BRU Battery Replaceable Unit...then just a paper qualification, e.g. Board or Battery Replaceable Unit ( BRU ) testing. 5 After-market Package The Die is Available and Can Be...Encapsulated Microcircuits (PEM), speed change, failure rate) 8 Emulation Manufacture or re-engineering of a FFF Replacement 9 CCA or BRU Redesign Board

  18. RF subsystem design for microwave communication receivers

    NASA Astrophysics Data System (ADS)

    Bickford, W. J.; Brodsky, W. G.

    A system review of the RF subsystems of (IFF) transponders, tropscatter receivers and SATCOM receivers is presented. The quantity potential for S-band and X-band IFF transponders establishes a baseline requirement. From this, the feasibility of a common design for these and other receivers is evaluated. Goals are established for a GaAs MMIC (monolithic microwave integrated circuit) device and related local oscillator preselector and self-test components.

  19. Bicarbonate secretion and non-Na component of the short-circuit current in the isolated colonic mucosa of Bufo arenarum

    PubMed Central

    Carlisky, N. J.; Lew, V. L.

    1970-01-01

    1. In the isolated colonic mucosa of Bufo arenarum, under special circumstances, there is a variable fraction of the short-circuit current (0-38%) that is unaccounted for by either the Na or the Cl and bicarbonate transmembrane net fluxes. 2. The hypothesis that a special kind of bicarbonate transport may account for the non-Na component of the short-circuit current was investigated. According to this, bicarbonate ions formed within the membrane await transport towards the mucosal solution within a compartment that does not undergo isotopic exchange with the serosal bathing solution. This kind of transport may be detected by a lowering of mucosal specific activity of bicarbonate but would not be revealed by the classic method of comparing the difference between the unidirectional fluxes with the short-circuit current. 3. The specific activity of bicarbonate was determined in the inside solution (initially bicarbonate-free) of ten normal and four everted colonic sacs incubated in an external medium (reservoir) containing a constant specific activity of bicarbonate. Comparison between membrane-to-internal solution bicarbonate flux and non-Na component of the short-circuit current was carried out in two different ways: (a) by measuring the remaining short-circuit current in Na-free medium and (b) by determining simultaneously the Na net flux. 4. Whatever the value of the short-circuit current and its non-Na component, there is no reduction of the specific activity of the bicarbonate appearing in the inside solution of the everted colonic sacs. 5. In the normal sacs there is a reduction of the specific activity of bicarbonate which accounts for a membrane-to-mucosa bicarbonate flux which parallels the variations of the non-Na component of the short-circuit current although quantitatively representing only 68-87% of it. 6. There is no systematic decrease in the rate of reduction of the mucosal specific activity of bicarbonate in successive experimental flux periods; this excludes a slow equilibration of the intracellular bicarbonate with serosal bicarbonate. 7. Other possible explanations of the present results are discussed, as well as the availability and hydration rate of metabolic CO2 necessary to account for this kind of bicarbonate transport. PMID:5498504

  20. Optical sensors for electrical elements of a medium voltage distribution network

    NASA Astrophysics Data System (ADS)

    De Maria, Letizia; Bartalesi, Daniele; Serragli, Paolo; Paladino, Domenico

    2012-04-01

    The aging of most of the components of the National transmission and distribution system can potentially influence the reliability of power supply in a Medium Voltage (MV) network. In order to prevent possible dangerous situations, selected diagnostic indicators on electrical parts exploiting reliable and potentially low-cost sensors are required. This paper presents results concerning two main research activities regarding the development and application of innovative optical sensors for the diagnostic of MV electrical components. The first concerns a multi-sensor prototype for the detection of pre-discharges in MV switchboards: it is the combination of three different types of sensors operating simultaneously to detect incipient failure and to reduce the occurrence of false alarms. The system is real-time controlled by an embedded computer through a LabView interface. The second activity refers to a diagnostic tool to provide significant real-time information about early aging of MV/Low Voltage (LV) transformers by means of its vibration fingerprint. A miniaturized Optical Micro-Electro-Mechanical System (MEMS) based unit has been assembled for vibration measurements, wireless connected to a remote computer and controlled via LabView interface. Preliminary comparative tests were carried out with standard piezoelectric accelerometers on a conventional MV/LV test transformer under open circuit and in short-circuited configuration.

  1. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to the...

  2. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to the...

  3. Connector and electronic circuit assembly for improved wet insulation resistance

    DOEpatents

    Reese, Jason A.; Teli, Samar R.; Keenihan, James R.; Langmaid, Joseph A.; Maak, Kevin D.; Mills, Michael E.; Plum, Timothy C.; Ramesh, Narayan

    2016-07-19

    The present invention is premised upon a connector and electronic circuit assembly (130) at least partially encased in a polymeric frame (200). The assembly including at least: a connector housing (230); at least one electrical connector (330); at least one electronic circuit component (430); and at least one barrier element (530).

  4. Improved RF Isolation Amplifier

    NASA Technical Reports Server (NTRS)

    Stevens, G. L.; Macconnell, J.

    1985-01-01

    Circuit has high reverse isolation and wide bandwidth. Wideband isolation amplifier has low intermodulation distortion and high reverse isolation. Circuit does not require selected or matched components or directional coupling device. Circuit used in applications requiring high reverse isolation such as receiver intermediate-frequency (IF) strips and frequency distribution systems. Also applicable in RF and video signaling.

  5. 76 FR 58040 - Certain Coaxial Cable Connectors and Components Thereof and Products Containing Same; Notice of...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2011-09-19

    ... United States Court of Appeals for the Federal Circuit (``Federal Circuit'') in John Mezzalingua... public record for this investigation may be viewed on the Commission's electronic docket (EDIS) at http... for the `257 patent. Complainant PPC appealed to the Federal Circuit. In John Mezzalingua Associates v...

  6. Mechanically Flexible and High-Performance CMOS Logic Circuits.

    PubMed

    Honda, Wataru; Arie, Takayuki; Akita, Seiji; Takei, Kuniharu

    2015-10-13

    Low-power flexible logic circuits are key components required by the next generation of flexible electronic devices. For stable device operation, such components require a high degree of mechanical flexibility and reliability. Here, the mechanical properties of low-power flexible complementary metal-oxide-semiconductor (CMOS) logic circuits including inverter, NAND, and NOR are investigated. To fabricate CMOS circuits on flexible polyimide substrates, carbon nanotube (CNT) network films are used for p-type transistors, whereas amorphous InGaZnO films are used for the n-type transistors. The power consumption and voltage gain of CMOS inverters are <500 pW/mm at Vin = 0 V (<7.5 nW/mm at Vin = 5 V) and >45, respectively. Importantly, bending of the substrate is not found to cause significant changes in the device characteristics. This is also observed to be the case for more complex flexible NAND and NOR logic circuits for bending states with a curvature radius of 2.6 mm. The mechanical stability of these CMOS logic circuits makes them ideal candidates for use in flexible integrated devices.

  7. Mechanically Flexible and High-Performance CMOS Logic Circuits

    PubMed Central

    Honda, Wataru; Arie, Takayuki; Akita, Seiji; Takei, Kuniharu

    2015-01-01

    Low-power flexible logic circuits are key components required by the next generation of flexible electronic devices. For stable device operation, such components require a high degree of mechanical flexibility and reliability. Here, the mechanical properties of low-power flexible complementary metal–oxide–semiconductor (CMOS) logic circuits including inverter, NAND, and NOR are investigated. To fabricate CMOS circuits on flexible polyimide substrates, carbon nanotube (CNT) network films are used for p-type transistors, whereas amorphous InGaZnO films are used for the n-type transistors. The power consumption and voltage gain of CMOS inverters are <500 pW/mm at Vin = 0 V (<7.5 nW/mm at Vin = 5 V) and >45, respectively. Importantly, bending of the substrate is not found to cause significant changes in the device characteristics. This is also observed to be the case for more complex flexible NAND and NOR logic circuits for bending states with a curvature radius of 2.6 mm. The mechanical stability of these CMOS logic circuits makes them ideal candidates for use in flexible integrated devices. PMID:26459882

  8. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  9. Top-Down Modulation on Perceptual Decision with Balanced Inhibition through Feedforward and Feedback Inhibitory Neurons

    PubMed Central

    Wang, Cheng-Te; Lee, Chung-Ting; Wang, Xiao-Jing; Lo, Chung-Chuan

    2013-01-01

    Recent physiological studies have shown that neurons in various regions of the central nervous systems continuously receive noisy excitatory and inhibitory synaptic inputs in a balanced and covaried fashion. While this balanced synaptic input (BSI) is typically described in terms of maintaining the stability of neural circuits, a number of experimental and theoretical studies have suggested that BSI plays a proactive role in brain functions such as top-down modulation for executive control. Two issues have remained unclear in this picture. First, given the noisy nature of neuronal activities in neural circuits, how do the modulatory effects change if the top-down control implements BSI with different ratios between inhibition and excitation? Second, how is a top-down BSI realized via only excitatory long-range projections in the neocortex? To address the first issue, we systematically tested how the inhibition/excitation ratio affects the accuracy and reaction times of a spiking neural circuit model of perceptual decision. We defined an energy function to characterize the network dynamics, and found that different ratios modulate the energy function of the circuit differently and form two distinct functional modes. To address the second issue, we tested BSI with long-distance projection to inhibitory neurons that are either feedforward or feedback, depending on whether these inhibitory neurons do or do not receive inputs from local excitatory cells, respectively. We found that BSI occurs in both cases. Furthermore, when relying on feedback inhibitory neurons, through the recurrent interactions inside the circuit, BSI dynamically and automatically speeds up the decision by gradually reducing its inhibitory component in the course of a trial when a decision process takes too long. PMID:23626812

  10. Top-down modulation on perceptual decision with balanced inhibition through feedforward and feedback inhibitory neurons.

    PubMed

    Wang, Cheng-Te; Lee, Chung-Ting; Wang, Xiao-Jing; Lo, Chung-Chuan

    2013-01-01

    Recent physiological studies have shown that neurons in various regions of the central nervous systems continuously receive noisy excitatory and inhibitory synaptic inputs in a balanced and covaried fashion. While this balanced synaptic input (BSI) is typically described in terms of maintaining the stability of neural circuits, a number of experimental and theoretical studies have suggested that BSI plays a proactive role in brain functions such as top-down modulation for executive control. Two issues have remained unclear in this picture. First, given the noisy nature of neuronal activities in neural circuits, how do the modulatory effects change if the top-down control implements BSI with different ratios between inhibition and excitation? Second, how is a top-down BSI realized via only excitatory long-range projections in the neocortex? To address the first issue, we systematically tested how the inhibition/excitation ratio affects the accuracy and reaction times of a spiking neural circuit model of perceptual decision. We defined an energy function to characterize the network dynamics, and found that different ratios modulate the energy function of the circuit differently and form two distinct functional modes. To address the second issue, we tested BSI with long-distance projection to inhibitory neurons that are either feedforward or feedback, depending on whether these inhibitory neurons do or do not receive inputs from local excitatory cells, respectively. We found that BSI occurs in both cases. Furthermore, when relying on feedback inhibitory neurons, through the recurrent interactions inside the circuit, BSI dynamically and automatically speeds up the decision by gradually reducing its inhibitory component in the course of a trial when a decision process takes too long.

  11. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Shah, Kedar G.; Pannu, Satinderpall S.

    An integrated circuit system having an integrated circuit (IC) component which is able to have its functionality destroyed upon receiving a command signal. The system may involve a substrate with the IC component being supported on the substrate. A module may be disposed in proximity to the IC component. The module may have a cavity and a dissolving compound in a solid form disposed in the cavity. A heater component may be configured to heat the dissolving compound to a point of sublimation where the dissolving compound changes from a solid to a gaseous dissolving compound. A triggering mechanism maymore » be used for initiating a dissolution process whereby the gaseous dissolving compound is allowed to attack the IC component and destroy a functionality of the IC component.« less

  12. Magnetic-Flux-Compensated Voltage Divider

    NASA Technical Reports Server (NTRS)

    Mata, Carlos T.

    2005-01-01

    A magnetic-flux-compensated voltage-divider circuit has been proposed for use in measuring the true potential across a component that is exposed to large, rapidly varying electric currents like those produced by lightning strikes. An example of such a component is a lightning arrester, which is typically exposed to currents of the order of tens of kiloamperes, having rise times of the order of hundreds of nanoseconds. Traditional voltage-divider circuits are not designed for magnetic-flux-compensation: They contain uncompensated loops having areas large enough that the transient magnetic fluxes associated with large transient currents induce spurious voltages large enough to distort voltage-divider outputs significantly. A drawing of the proposed circuit was not available at the time of receipt of information for this article. What is known from a summary textual description is that the proposed circuit would contain a total of four voltage dividers: There would be two mixed dividers in parallel with each other and with the component of interest (e.g., a lightning arrester), plus two mixed dividers in parallel with each other and in series with the component of interest in the same plane. The electrical and geometric configuration would provide compensation for induced voltages, including those attributable to asymmetry in the volumetric density of the lightning or other transient current, canceling out the spurious voltages and measuring the true voltage across the component.

  13. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be...

  14. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be...

  15. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, E.I. Jr.; Peterson, K.A.; Barton, D.L.

    1998-07-14

    An electron beam apparatus and method for testing a circuit are disclosed. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 {micro}m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits. 7 figs.

  16. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, Jr., Edward I.; Peterson, Kenneth A.; Barton, Daniel L.

    1998-01-01

    An electron beam apparatus and method for testing a circuit. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 .mu.m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits.

  17. In-line Microwave Warmer for Blood and Intravenous Fluids.

    DTIC Science & Technology

    1989-12-14

    circuit was designed and tested. This circuit uses a digitally controlled optically coupled Triac , a thyristor device, which acts as a switch to allow...three sites of the circuit : Inlet Port of Heating Chamber Interior Path of Heating Chamber Outlet Port of Heating Chamber 4) Feedback Control Mechanism...accomplished through use of a closed loop test circuit depicted in Figure 1-2. This test circuit can be used to heat iv fluids or blood on a continuous

  18. Functional test generation for digital circuits described with a declarative language: LUSTRE

    NASA Astrophysics Data System (ADS)

    Almahrous, Mazen

    1990-08-01

    A functional approach to the test generation problem starting from a high level description is proposed. The circuit tested is modeled, using the LUSTRE high level data flow description language. The different LUSTRE primitives are translated to a SATAN format graph in order to evaluate the testability of the circuit and to generate test sequences. Another method of testing the complex circuits comprising an operative part and a control part is defined. It consists of checking experiments for the control part observed through the operative part. It was applied to the automata generated from a LUSTRE description of the circuit.

  19. Deconstructing and constructing innate immune functions using molecular sensors and actuators

    NASA Astrophysics Data System (ADS)

    Coutinho, Kester; Inoue, Takanari

    2016-05-01

    White blood cells such as neutrophils and macrophages are made competent for chemotaxis and phagocytosis -- the dynamic cellular behaviors that are hallmarks of their innate immune functions -- by the reorganization of complex biological circuits during differentiation. Conventional loss-of-function approaches have revealed that more than 100 genes participate in these cellular functions, and we have begun to understand the intricate signaling circuits that are built up from these gene products. We now appreciate: (1) that these circuits come in a variety of flavors -- so that we can make a distinction between genetic circuits, metabolic circuits and signaling circuits; and (2) that they are usually so complex that the assumption of multiple feedback loops, as well as that of crosstalk between seemingly independent pathways, is now routine. It has not escaped our notice, however, that just as physicists and electrical engineers have long been able to disentangle complex electric circuits simply by repetitive cycles of probing and measuring electric currents using a voltmeter, we might similarly be able to dissect these intricate biological circuits by incorporating equivalent approaches in the fields of cell biology and bioengineering. Existing techniques in biology for probing individual circuit components are unfortunately lacking, so that the overarching goal of drawing an exact circuit diagram for the whole cell -- complete with kinetic parameters for connections between individual circuit components -- is not yet in near sight. My laboratory and others have thus begun the development of a new series of molecular tools that can measurably investigate the circuit connectivity inside living cells, as if we were doing so on a silicon board. In these proceedings, I will introduce some of these techniques, provide examples of their implementation, and offer a perspective on directions moving forward.

  20. A lightweight solar array study

    NASA Technical Reports Server (NTRS)

    Josephs, R. H.

    1977-01-01

    A sample module was assembled to model a portion of a flexible extendable solar array, a type that promises to become the next generation of solar array design. The resulting study of this module is intended to provide technical support to the array designer for lightweight component selection, specifications, and tests. Selected from available lightweight components were 127-micron-thick wrap-around contacted solar cells, 34- micron-thick sputtered glass covers, and as a substrate a 13-micron-thick polyimide film clad with a copper printed circuit. Each component displayed weaknesses. The thin solar cells had excessive breakage losses. Sputtered glass cover adhesion was poor, and the covered cell was weaker than the cell uncovered. Thermal stresses caused some cell delamination from the model solar array substrate.

  1. Intrinsic neuromodulation: altering neuronal circuits from within.

    PubMed

    Katz, P S; Frost, W N

    1996-02-01

    There are two sources of neuromodulation for neuronal circuits: extrinsic inputs and intrinsic components of the circuits themselves. Extrinsic neuromodulation is known to be pervasive in nervous systems, but intrinsic neuromodulation is less recognized, despite the fact that it has now been demonstrated in sensory and neuromuscular circuits and in central pattern generators. By its nature, intrinsic neuromodulation produces local changes in neuronal computation, whereas extrinsic neuromodulation can cause global changes, often affecting many circuits simultaneously. Studies in a number of systems are defining the different properties of these two forms of neuromodulation.

  2. Delay test generation for synchronous sequential circuits

    NASA Astrophysics Data System (ADS)

    Devadas, Srinivas

    1989-05-01

    We address the problem of generating tests for delay faults in non-scan synchronous sequential circuits. Delay test generation for sequential circuits is a considerably more difficult problem than delay testing of combinational circuits and has received much less attention. In this paper, we present a method for generating test sequences to detect delay faults in sequential circuits using the stuck-at fault sequential test generator STALLION. The method is complete in that it will generate a delay test sequence for a targeted fault given sufficient CPU time, if such a sequence exists. We term faults for which no delay test sequence exists, under out test methodology, sequentially delay redundant. We describe means of eliminating sequential delay redundancies in logic circuits. We present a partial-scan methodology for enhancing the testability of difficult-to-test of untestable sequential circuits, wherein a small number of flip-flops are selected and made controllable/observable. The selection process guarantees the elimination of all sequential delay redundancies. We show that an intimate relationship exists between state assignment and delay testability of a sequential machine. We describe a state assignment algorithm for the synthesis of sequential machines with maximal delay fault testability. Preliminary experimental results using the test generation, partial-scan and synthesis algorithm are presented.

  3. Learning high-quality soldering

    NASA Technical Reports Server (NTRS)

    Read, W. S.

    1981-01-01

    Soldering techniques for high-reliability electronic equipment are taught in 5 day course at NASA's Jet Propulsion Laboratory. Topic covered include new circuit assembly, printed-wiring board reworking, circuit changes, wire routing, and component installation.

  4. A Translational Neuroscience Approach to Understanding the Development of Social Anxiety Disorder and its Pathophysiology

    PubMed Central

    Fox, Andrew S.; Kalin, Ned H.

    2014-01-01

    This review brings together recent research from molecular, neural circuit, animal model, and human studies to understand the neurodevelopmental mechanisms underlying Social Anxiety Disorder (SAD). SAD is common, debilitating, and often leads to further psychopathology. Numerous studies demonstrate that extremely behaviorally inhibited and temperamentally anxious young children are at marked risk to develop SAD. Recent work in human and nonhuman primates has identified a distributed brain network that underlies early-life anxiety including: central nucleus of the amygdala, anterior hippocampus and orbitofrontal cortex. Moreover, studies in nonhuman primates demonstrate that alterations in this circuit are trait-like in that they are stable over time and across contexts. Importantly, the components of this circuit are differentially influenced by heritable and environmental factors and specific lesion studies demonstrate a causal role for multiple components of the circuit. Molecular studies in rodents and primates are pointing to disrupted neurodevelopmental and neuroplastic processes within critical components of the early-life dispositional anxiety neural circuit. The possibility of identifying an early-life at-risk phenotype, along with an understanding of its neurobiology, provides an unusual opportunity to conceptualize novel preventive intervention strategies aimed at reducing the suffering of anxious children and preventing them from developing further psychopathology. PMID:25157566

  5. A translational neuroscience approach to understanding the development of social anxiety disorder and its pathophysiology.

    PubMed

    Fox, Andrew S; Kalin, Ned H

    2014-11-01

    This review brings together recent research from molecular, neural circuit, animal model, and human studies to help understand the neurodevelopmental mechanisms underlying social anxiety disorder. Social anxiety disorder is common and debilitating, and it often leads to further psychopathology. Numerous studies have demonstrated that extremely behaviorally inhibited and temperamentally anxious young children are at marked risk of developing social anxiety disorder. Recent work in human and nonhuman primates has identified a distributed brain network that underlies early-life anxiety including the central nucleus of the amygdala, the anterior hippocampus, and the orbitofrontal cortex. Studies in nonhuman primates have demonstrated that alterations in this circuit are trait-like in that they are stable over time and across contexts. Notably, the components of this circuit are differentially influenced by heritable and environmental factors, and specific lesion studies have demonstrated a causal role for multiple components of the circuit. Molecular studies in rodents and primates point to disrupted neurodevelopmental and neuroplastic processes within critical components of the early-life dispositional anxiety neural circuit. The possibility of identifying an early-life at-risk phenotype, along with an understanding of its neurobiology, provides an unusual opportunity to conceptualize novel preventive intervention strategies aimed at reducing the suffering of anxious children and preventing them from developing further psychopathology.

  6. Neural learning circuits utilizing nano-crystalline silicon transistors and memristors.

    PubMed

    Cantley, Kurtis D; Subramaniam, Anand; Stiegler, Harvey J; Chapman, Richard A; Vogel, Eric M

    2012-04-01

    Properties of neural circuits are demonstrated via SPICE simulations and their applications are discussed. The neuron and synapse subcircuits include ambipolar nano-crystalline silicon transistor and memristor device models based on measured data. Neuron circuit characteristics and the Hebbian synaptic learning rule are shown to be similar to biology. Changes in the average firing rate learning rule depending on various circuit parameters are also presented. The subcircuits are then connected into larger neural networks that demonstrate fundamental properties including associative learning and pulse coincidence detection. Learned extraction of a fundamental frequency component from noisy inputs is demonstrated. It is then shown that if the fundamental sinusoid of one neuron input is out of phase with the rest, its synaptic connection changes differently than the others. Such behavior indicates that the system can learn to detect which signals are important in the general population, and that there is a spike-timing-dependent component of the learning mechanism. Finally, future circuit design and considerations are discussed, including requirements for the memristive device.

  7. Accurate reliability analysis method for quantum-dot cellular automata circuits

    NASA Astrophysics Data System (ADS)

    Cui, Huanqing; Cai, Li; Wang, Sen; Liu, Xiaoqiang; Yang, Xiaokuo

    2015-10-01

    Probabilistic transfer matrix (PTM) is a widely used model in the reliability research of circuits. However, PTM model cannot reflect the impact of input signals on reliability, so it does not completely conform to the mechanism of the novel field-coupled nanoelectronic device which is called quantum-dot cellular automata (QCA). It is difficult to get accurate results when PTM model is used to analyze the reliability of QCA circuits. To solve this problem, we present the fault tree models of QCA fundamental devices according to different input signals. After that, the binary decision diagram (BDD) is used to quantitatively investigate the reliability of two QCA XOR gates depending on the presented models. By employing the fault tree models, the impact of input signals on reliability can be identified clearly and the crucial components of a circuit can be found out precisely based on the importance values (IVs) of components. So this method is contributive to the construction of reliable QCA circuits.

  8. Using Movies to Analyse Gene Circuit Dynamics in Single Cells

    PubMed Central

    Locke, James CW; Elowitz, Michael B

    2010-01-01

    Preface Many bacterial systems rely on dynamic genetic circuits to control critical processes. A major goal of systems biology is to understand these behaviours in terms of individual genes and their interactions. However, traditional techniques based on population averages wash out critical dynamics that are either unsynchronized between cells or driven by fluctuations, or ‘noise,’ in cellular components. Recently, the combination of time-lapse microscopy, quantitative image analysis, and fluorescent protein reporters has enabled direct observation of multiple cellular components over time in individual cells. In conjunction with mathematical modelling, these techniques are now providing powerful insights into genetic circuit behaviour in diverse microbial systems. PMID:19369953

  9. SQUARE WAVE AMPLIFIER

    DOEpatents

    Leavitt, M.A.; Lutz, I.C.

    1958-08-01

    An amplifier circuit is described for amplifying sigmals having an alternating current component superimposed upon a direct current component, without loss of any segnnent of the alternating current component. The general circuit arrangement includes a vibrator, two square wave amplifiers, and recombination means. The amplifier input is connected to the vibrating element of the vibrator and is thereby alternately applied to the input of each square wave amplifier. The detailed circuitry of the recombination means constitutes the novelty of the annplifier and consists of a separate, dual triode amplifier coupled to the output of each square wave amplifier with a recombination connection from the plate of one amplifier section to a grid of one section of the other amplifier. The recombination circuit has provisions for correcting distortion caused by overlapping of the two square wave voltages from the square wave amplifiers.

  10. Verification and Quantification of Single Event Effects on High Speed SRAM in Terrestrial Environments

    NASA Technical Reports Server (NTRS)

    Huff, H.; You, Z.; Williams, T.; Nichols, T.; Attia, J.; Fogarty, T. N.; Kirby, K.; Wilkins, R.; Lawton, R.

    1998-01-01

    As integrated circuits become more sensitive to charged particles and neutrons, anomalous performance due to single event effects (SEE) is a concern and requires experimental verification and quantification. The Center for Applied Radiation Research (CARR) at Prairie View A&M University has developed experiments as a participant in the NASA ER-2 Flight Program, the APEX balloon flight program and the Student Launch Program. Other high altitude and ground level experiments of interest to DoD and commercial applications are being developed. The experiment characterizes the SEE behavior of high speed and high density SRAM's. The system includes a PC-104 computer unit, an optical drive for storage, a test board with the components under test, and a latchup detection and reset unit. The test program will continuously monitor the stored checkerboard data pattern in the SW and record errors. Since both the computer and the optical drive contain integrated circuits, they are also vulnerable to radiation effects. A latchup detection unit with discrete components will monitor the test program and reset the system when necessary. The first results will be obtained from the NASA ER-2 flights, which are now planned to take place in early 1998 from Dryden Research Center in California. The series of flights, at altitudes up to 70,000 feet, and a variety of flight profiles should yield a distribution of conditions for correlating SEES. SEE measurements will be performed from the time of aircraft power-up on the ground throughout the flight regime until systems power-off after landing.

  11. Test and evaluation of load converter topologies used in the Space Station Freedom Power Management and distribution DC test bed

    NASA Technical Reports Server (NTRS)

    Lebron, Ramon C.; Oliver, Angela C.; Bodi, Robert F.

    1991-01-01

    Power components hardware in support of the Space Station Freedom dc Electrical Power System were tested. One type of breadboard hardware tested is the dc Load Converter Unit, which constitutes the power interface between the electric power system and the actual load. These units are dc to dc converters that provide the final system regulation before power is delivered to the load. Three load converters were tested: a series resonant converter, a series inductor switchmode converter, and a switching full-bridge forward converter. The topology, operation principles, and tests results are described, in general. A comparative analysis of the three units is given with respect to efficiency, regulation, short circuit behavior (protection), and transient characteristics.

  12. Resonant snubber inverter

    DOEpatents

    Lai, Jih-Sheng; Young, Sr., Robert W.; Chen, Daoshen; Scudiere, Matthew B.; Ott, Jr., George W.; White, Clifford P.; McKeever, John W.

    1997-01-01

    A resonant, snubber-based, soft switching, inverter circuit achieves lossless switching during dc-to-ac power conversion and power conditioning with minimum component count and size. Current is supplied to the resonant snubber branches solely by the main inverter switches. Component count and size are reduced by use of a single semiconductor switch in the resonant snubber branches. Component count is also reduced by maximizing the use of stray capacitances of the main switches as parallel resonant capacitors. Resonance charging and discharging of the parallel capacitances allows lossless, zero voltage switching. In one embodiment, circuit component size and count are minimized while achieving lossless, zero voltage switching within a three-phase inverter.

  13. Resonant snubber inverter

    DOEpatents

    Lai, J.S.; Young, R.W. Sr.; Chen, D.; Scudiere, M.B.; Ott, G.W. Jr.; White, C.P.; McKeever, J.W.

    1997-06-24

    A resonant, snubber-based, soft switching, inverter circuit achieves lossless switching during dc-to-ac power conversion and power conditioning with minimum component count and size. Current is supplied to the resonant snubber branches solely by the main inverter switches. Component count and size are reduced by use of a single semiconductor switch in the resonant snubber branches. Component count is also reduced by maximizing the use of stray capacitances of the main switches as parallel resonant capacitors. Resonance charging and discharging of the parallel capacitances allows lossless, zero voltage switching. In one embodiment, circuit component size and count are minimized while achieving lossless, zero voltage switching within a three-phase inverter. 14 figs.

  14. Studies in geophysics: The Earth's electrical environment

    NASA Astrophysics Data System (ADS)

    The Earth is electrified. Between the surface and the outer reaches of the atmosphere, there is a global circuit that is maintained by worldwide thunderstorm activity and by upper atmospheric dynamo processes. The highest voltages approach a billion volts and are generated within thunderclouds, where lightning is a visual display of the cloud's electrical nature. The largest currents in the circuit, approaching a million amperes, are associated with the aurora. Because there have been significant advances in understanding many of the component parts of the global electric circuit (lightning, cloud electrification, electrical processes in specific atmospheric regions, and telluric currents), a principal research challenge is to understand how these components interact to shape the global circuit. Increased basic understanding in this field has many potential practical applications, including lightning protection, the design of advanced aircraft and spacecraft, and improvements in weather prediction.

  15. Body Fluids Monitor

    NASA Technical Reports Server (NTRS)

    Siconolfi, Steven F. (Inventor)

    2000-01-01

    Method and apparatus are described for determining volumes of body fluids in a subject using bioelectrical response spectroscopy. The human body is represented using an electrical circuit. Intra-cellular water is represented by a resistor in series with a capacitor; extra-cellular water is represented by a resistor in series with two parallel inductors. The parallel inductors represent the resistance due to vascular fluids. An alternating, low amperage, multifrequency signal is applied to determine a subject's impedance and resistance. From these data, statistical regression is used to determine a 1% impedance where the subject's impedance changes by no more than 1% over a 25 kHz interval. Circuit component, of the human body circuit are determined based on the 1% impedance. Equations for calculating total body water, extra-cellular water, total blood volume, and plasma volume are developed based on the circuit components.

  16. Studies in geophysics: The Earth's electrical environment

    NASA Technical Reports Server (NTRS)

    1986-01-01

    The Earth is electrified. Between the surface and the outer reaches of the atmosphere, there is a global circuit that is maintained by worldwide thunderstorm activity and by upper atmospheric dynamo processes. The highest voltages approach a billion volts and are generated within thunderclouds, where lightning is a visual display of the cloud's electrical nature. The largest currents in the circuit, approaching a million amperes, are associated with the aurora. Because there have been significant advances in understanding many of the component parts of the global electric circuit (lightning, cloud electrification, electrical processes in specific atmospheric regions, and telluric currents), a principal research challenge is to understand how these components interact to shape the global circuit. Increased basic understanding in this field has many potential practical applications, including lightning protection, the design of advanced aircraft and spacecraft, and improvements in weather prediction.

  17. Modal and polarization qubits in Ti:LiNbO3 photonic circuits for a universal quantum logic gate.

    PubMed

    Saleh, Mohammed F; Di Giuseppe, Giovanni; Saleh, Bahaa E A; Teich, Malvin Carl

    2010-09-13

    Lithium niobate photonic circuits have the salutary property of permitting the generation, transmission, and processing of photons to be accommodated on a single chip. Compact photonic circuits such as these, with multiple components integrated on a single chip, are crucial for efficiently implementing quantum information processing schemes.We present a set of basic transformations that are useful for manipulating modal qubits in Ti:LiNbO(3) photonic quantum circuits. These include the mode analyzer, a device that separates the even and odd components of a state into two separate spatial paths; the mode rotator, which rotates the state by an angle in mode space; and modal Pauli spin operators that effect related operations. We also describe the design of a deterministic, two-qubit, single-photon, CNOT gate, a key element in certain sets of universal quantum logic gates. It is implemented as a Ti:LiNbO(3) photonic quantum circuit in which the polarization and mode number of a single photon serve as the control and target qubits, respectively. It is shown that the effects of dispersion in the CNOT circuit can be mitigated by augmenting it with an additional path. The performance of all of these components are confirmed by numerical simulations. The implementation of these transformations relies on selective and controllable power coupling among single- and two-mode waveguides, as well as the polarization sensitivity of the Pockels coefficients in LiNbO(3).

  18. Design, Experiments and Simulation of Voltage Transformers on the Basis of a Differential Input D-dot Sensor

    PubMed Central

    Wang, Jingang; Gao, Can; Yang, Jie

    2014-01-01

    Currently available traditional electromagnetic voltage sensors fail to meet the measurement requirements of the smart grid, because of low accuracy in the static and dynamic ranges and the occurrence of ferromagnetic resonance attributed to overvoltage and output short circuit. This work develops a new non-contact high-bandwidth voltage measurement system for power equipment. This system aims at the miniaturization and non-contact measurement of the smart grid. After traditional D-dot voltage probe analysis, an improved method is proposed. For the sensor to work in a self-integrating pattern, the differential input pattern is adopted for circuit design, and grounding is removed. To prove the structure design, circuit component parameters, and insulation characteristics, Ansoft Maxwell software is used for the simulation. Moreover, the new probe was tested on a 10 kV high-voltage test platform for steady-state error and transient behavior. Experimental results ascertain that the root mean square values of measured voltage are precise and that the phase error is small. The D-dot voltage sensor not only meets the requirement of high accuracy but also exhibits satisfactory transient response. This sensor can meet the intelligence, miniaturization, and convenience requirements of the smart grid. PMID:25036333

  19. Design of a miniature wind turbine for powering wireless sensors

    NASA Astrophysics Data System (ADS)

    Xu, F. J.; Yuan, F. G.; Hu, J. Z.; Qiu, Y. P.

    2010-04-01

    In this paper, a miniature wind turbine (MWT) system composed of commercially available off-the-shelf components was designed and tested for harvesting energy from ambient airflow to power wireless sensors. To make MWT operate at very low air flow rates, a 7.6 cm thorgren plastic Propeller blade was adopted as the wind turbine blade. A sub watt brushless DC motor was used as generator. To predict the performance of the MWT, an equivalent circuit model was employed for analyzing the output power and the net efficiency of the MWT system. In theory, the maximum net efficiency 14.8% of the MWT system was predicted. Experimental output power of the MWT versus resistive loads ranging from 5 ohms to 500 ohms under wind speeds from 3 m/s to 4.5 m/s correlates well with those from the predicted model, which means that the equivalent circuit model provides a guideline for optimizing the performance of the MWT and can be used for fulfilling the design requirements by selecting specific components for powering wireless sensors.

  20. Quantitative Biofractal Feedback Part II ’Devices, Scalability & Robust Control’

    DTIC Science & Technology

    2008-05-01

    in the modelling of proton exchange membrane fuel cells ( PEMFC ) may work as a powerful tool in the development and widespread testing of alternative...energy sources in the next decade [9], where biofractal controllers will be used to control these complex systems. The dynamic model of PEMFC , is...dynamic response of the PEMFC . In the Iftukhar model, the fuel cell is represented by an equivalent circuit, whose components are identified with

  1. Fault tolerance analysis and applications to microwave modules and MMIC's

    NASA Astrophysics Data System (ADS)

    Boggan, Garry H.

    A project whose objective was to provide an overview of built-in-test (BIT) considerations applicable to microwave systems, modules, and MMICs (monolithic microwave integrated circuits) is discussed. Available analytical techniques and software for assessing system failure characteristics were researched, and the resulting investigation provides a review of two techniques which have applicability to microwave systems design. A system-level approach to fault tolerance and redundancy management is presented in its relationship to the subsystem/element design. An overview of the microwave BIT focus from the Air Force Integrated Diagnostics program is presented. The technical reports prepared by the GIMADS team were reviewed for applicability to microwave modules and components. A review of MIMIC (millimeter and microwave integrated circuit) program activities relative to BIT/BITE is given.

  2. Design of a smart ECG garment based on conductive textile electrode and flexible printed circuit board.

    PubMed

    Cai, Zhipeng; Luo, Kan; Liu, Chengyu; Li, Jianqing

    2017-08-09

    A smart electrocardiogram (ECG) garment system was designed for continuous, non-invasive and comfortable ECG monitoring, which mainly consists of four components: Conductive textile electrode, garment, flexible printed circuit board (FPCB)-based ECG processing module and android application program. Conductive textile electrode and FPCB-based ECG processing module (6.8 g, 55 mm × 53 mm × 5 mm) are identified as two key techniques to improve the system's comfort and flexibility. Preliminary experimental results verified that the textile electrodes with circle shape, 40 mm size in diameter, and 5 mm thickness sponge are best suited for the long-term ECG monitoring application. The tests on the whole system confirmed that the designed smart garment can obtain long-term ECG recordings with high signal quality.

  3. Development of a two-dimensional skin friction balance nulling circuit using multivariable control theory

    NASA Technical Reports Server (NTRS)

    Tripp, John S.; Patek, Stephen D.

    1988-01-01

    Measurement of planar skin friction forces in aerodynamic testing currently requires installation of two perpendicularly mounted, single-axis balances; consequently, force components must be sensed at two distinct locations. A two-axis instrument developed at the Langley Research Center to overcome this disadvantage allows measurement of a two-dimensional force at one location. This paper describes a feedback-controlled nulling circuit developed for the NASA two-axis balance which, without external compensation, is inherently unstable because of its low friction mechanical design. Linear multivariable control theory is applied to an experimentally validated mathematical model of the balance to synthesize a state-variable feedback control law. Pole placement techniques and computer simulation studies are employed to select eigenvalues which provide ideal transient response with decoupled sensing dynamics.

  4. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, J. A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  5. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyses required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  6. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such'as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAxwell's equations by the Finite Integration Algorithm (MAFIA) is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  7. A long time low drift integrator with temperature control

    NASA Astrophysics Data System (ADS)

    Zhang, Donglai; Yan, Xiaolan; Zhang, Enchao; Pan, Shimin

    2016-10-01

    The output of an operational amplifier always contains signals that could not have been predicted, even with knowledge of the input and an accurately determined closed-loop transfer function. These signals lead to integrator zero-drift over time. A new type of integrator system with a long-term low-drift characteristic has therefore been designed. The integrator system is composed of a temperature control module and an integrator module. The aluminum printed circuit board of the integrator is glued to a thermoelectric cooler to maintain the electronic components at a stable temperature. The integration drift is automatically compensated using an analog-to-digital converter/proportional integration/digital-to-analog converter control circuit. Performance testing in a standard magnet shows that the proposed integrator, which has an integration time constant of 10 ms, has a low integration drift (<5 mV) over 1000 s after repeated measurements. The integrator can be used for magnetic flux measurements in most tokamaks and in the wire rope nondestructive test.

  8. A long time low drift integrator with temperature control.

    PubMed

    Zhang, Donglai; Yan, Xiaolan; Zhang, Enchao; Pan, Shimin

    2016-10-01

    The output of an operational amplifier always contains signals that could not have been predicted, even with knowledge of the input and an accurately determined closed-loop transfer function. These signals lead to integrator zero-drift over time. A new type of integrator system with a long-term low-drift characteristic has therefore been designed. The integrator system is composed of a temperature control module and an integrator module. The aluminum printed circuit board of the integrator is glued to a thermoelectric cooler to maintain the electronic components at a stable temperature. The integration drift is automatically compensated using an analog-to-digital converter/proportional integration/digital-to-analog converter control circuit. Performance testing in a standard magnet shows that the proposed integrator, which has an integration time constant of 10 ms, has a low integration drift (<5 mV) over 1000 s after repeated measurements. The integrator can be used for magnetic flux measurements in most tokamaks and in the wire rope nondestructive test.

  9. A non-contact capacitance based electrocardiograph and associated heart-rate detection using enhanced Fourier interpolation method.

    PubMed

    Kumar Thakur, Rupak; Anoop, C S

    2015-08-01

    Cardio-vascular health monitoring has gained considerable attention in the recent years. Principle of non-contact capacitive electrocardiograph (ECG) and its applicability as a valuable, low-cost, easy-to-use scheme for cardio-vascular health monitoring has been demonstrated in some recent research papers. In this paper, we develop a complete non-contact ECG system using a suitable front-end electronic circuit and a heart-rate (HR) measurement unit using enhanced Fourier interpolation technique. The front-end electronic circuit is realized using low-cost, readily available components and the proposed HR measurement unit is designed to achieve fairly accurate results. The entire system has been extensively tested to verify its efficacy and test results show that the developed system can estimate HR with an accuracy of ±2 beats. Detailed tests have been conducted to validate the performance of the system for different cloth thicknesses of the subject. Some basic tests which illustrate the application of the proposed system for heart-rate variability estimation has been conducted and results reported. The developed system can be used as a portable, reliable, long-term cardiac health monitoring device and can be extended to human drowsiness detection.

  10. Design and optimization of LCL-VSC grid-tied converter having short circuit fault current limiting ability

    NASA Astrophysics Data System (ADS)

    Liu, Mengqi; Liu, Haijun; Wang, Zhikai

    2017-01-01

    Traditional LCL grid-tied converters haven't the ability to limit the short-circuit fault current and only remove grid-connected converter using the breaker. However, the VSC converters become uncontrollable after the short circuit fault cutting off and the power switches may be damaged if the circuit breaker removes slowly. Compared to the filter function of the LCL passive components in traditional VSC converters, the novel LCL-VSC converter has the ability of limiting the short circuit fault current using the reasonable designed LCL parameters. In this paper the mathematical model of the LCL converter is established and the characteristics of the short circuit fault current generated by the ac side and dc side are analyzed. Thus one design and optimization scheme of the reasonable LCL passive parameter is proposed for the LCL-VSC converter having short circuit fault current limiting ability. In addition to ensuring the LCL passive components filtering the high-frequency harmonic, this scheme also considers the impedance characteristics to limit the fault current of AC and DC short circuit fault respectively flowing through the power switch no more than the maximum allowable operating current, in order to make the LCL converter working continuously. Finally, the 200kW simulation system is set up to prove the validity and feasibility of the theoretical analysis using the proposed design and optimization scheme.

  11. Intelligent pump test system based on virtual instrument

    NASA Astrophysics Data System (ADS)

    Ma, Jungong; Wang, Shifu; Wang, Zhanlin

    2003-09-01

    The intelligent pump system is the key component of the aircraft hydraulic system that can solve the problem, such as the temperature sharply increasing. As the performance of the intelligent pump directly determines that of the aircraft hydraulic system and seriously affects fly security and reliability. So it is important to test all kinds of performance parameters of intelligent pump during design and development, while the advanced, reliable and complete test equipments are the necessary instruments for achieving the goal. In this paper, the application of virtual instrument and computer network technology in aircraft intelligent pump test is presented. The composition of the hardware, software, hydraulic circuit in this system are designed and implemented.

  12. Solid-State Lighting Module (SSLM)

    NASA Technical Reports Server (NTRS)

    2008-01-01

    The project's goal was to build a light-emitting-diode (LED)-based light fixture that is identical in fit, form, and function to the existing International Space Station (ISS) General Luminaire Assembly (GLA) light fixture and fly it on the ISS in early FY 2008 as a Station Detailed Test Objective (SDTO). Our design offers the following strengths: proven component hardware: Our design uses components flown in other KSC-developed hardware; heat path thermal pad: LED array heat is transferred from the circuit board by silicon pad, negating the need for a cooling fan; variable colorimetry: The output light color can be changed by inserting different LED combinations.

  13. Field-programmable lab-on-a-chip based on microelectrode dot array architecture.

    PubMed

    Wang, Gary; Teng, Daniel; Lai, Yi-Tse; Lu, Yi-Wen; Ho, Yingchieh; Lee, Chen-Yi

    2014-09-01

    The fundamentals of electrowetting-on-dielectric (EWOD) digital microfluidics are very strong: advantageous capability in the manipulation of fluids, small test volumes, precise dynamic control and detection, and microscale systems. These advantages are very important for future biochip developments, but the development of EWOD microfluidics has been hindered by the absence of: integrated detector technology, standard commercial components, on-chip sample preparation, standard manufacturing technology and end-to-end system integration. A field-programmable lab-on-a-chip (FPLOC) system based on microelectrode dot array (MEDA) architecture is presented in this research. The MEDA architecture proposes a standard EWOD microfluidic component called 'microelectrode cell', which can be dynamically configured into microfluidic components to perform microfluidic operations of the biochip. A proof-of-concept prototype FPLOC, containing a 30 × 30 MEDA, was developed by using generic integrated circuits computer aided design tools, and it was manufactured with standard low-voltage complementary metal-oxide-semiconductor technology, which allows smooth on-chip integration of microfluidics and microelectronics. By integrating 900 droplet detection circuits into microelectrode cells, the FPLOC has achieved large-scale integration of microfluidics and microelectronics. Compared to the full-custom and bottom-up design methods, the FPLOC provides hierarchical top-down design approach, field-programmability and dynamic manipulations of droplets for advanced microfluidic operations.

  14. The inside-out supercapacitor: induced charge storage in reduced graphene oxide.

    PubMed

    Martin, Samuel T; Akbari, Abozar; Chakraborty Banerjee, Parama; Neild, Adrian; Majumder, Mainak

    2016-11-30

    Iontronic circuits are built using components which are analogous to those used in electronic circuits, however they involve the movement of ions in an electrolyte rather than electrons in a metal or semiconductor. Developments in these circuits' performance have led to applications in biological sensing, interfacing and drug delivery. While transistors, diodes and elementary logic circuits have been demonstrated for ionic circuits if more complex circuits are to be realized, the precident set by electrical circuits suggests that a component which is analogous to an electrical capacitor is required. Herein, an ionic supercapacitor is reported, our experiments show that charge may be stored in a conductive porous reduced graphene oxide film that is contacted by two isolated aqueous solutions and that this concept extends to an arbitrary polarizable sample. Parametric studies indicate that the conductivity and porosity of this film play important roles in the resultant device's performance. This ionic capacitor has a specific capacitance of 8.6 F cm -3 at 1 mV s -1 and demonstrates the ability to filter and smooth signals in an electrolyte at a variety of low frequencies. The device has the same interfaces as a supercapacitor but their arrangement is changed, hence the name inside-out supercapacitor.

  15. Product assurance technology for custom LSI/VLSI electronics

    NASA Technical Reports Server (NTRS)

    Buehler, M. G.; Blaes, B. R.; Jennings, G. A.; Moore, B. T.; Nixon, R. H.; Pina, C. A.; Sayah, H. R.; Sievers, M. W.; Stahlberg, N. F.

    1985-01-01

    The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification.

  16. Data Concentrator

    NASA Technical Reports Server (NTRS)

    Willett, Mike

    2015-01-01

    Orbital Research, Inc., developed, built, and tested three high-temperature components for use in the design of a data concentrator module in distributed turbine engine control. The concentrator receives analog and digital signals related to turbine engine control and communicates with a full authority digital engine control (FADEC) or high-level command processor. This data concentrator follows the Distributed Engine Controls Working Group (DECWG) roadmap for turbine engine distributed controls communication development that operates at temperatures at least up to 225 C. In Phase I, Orbital Research developed detailed specifications for each component needed for the system and defined the total system specifications. This entailed a combination of system design, compiling existing component specifications, laboratory testing, and simulation. The results showed the feasibility of the data concentrator. Phase II of this project focused on three key objectives. The first objective was to update the data concentrator design modifications from DECWG and prime contractors. Secondly, the project defined requirements for the three new high-temperature, application-specific integrated circuits (ASICs): one-time programmable (OTP), transient voltage suppression (TVS), and 3.3V. Finally, the project validated each design by testing over temperature and under load.

  17. Design of Timer Circuit for Dynamic Data System

    NASA Technical Reports Server (NTRS)

    Young, Nathaniel, III

    2004-01-01

    The Branch That I work in is in the Aero Electronic Test Branch, which is part of the Research and Testing Division. The Aero Electronic Test Branch deals with electronic control and instrumentation systems. This branch supports the research and test study of wind tunnels such as the l0x10,9x15, and 8x6. Wind tunnels are used in research to test certain parts of a jet, plane, shuttle or any other flying object in certain test conditions. My assignment is to design a programmable trigger circuit on a 19 standard rack mount that will allow the circuit to latch and hold for a predefined amount of time entered by the user when receiving a signal. It should then re-arm itself within 0.25 seconds after the time is finished. The time should be able to be seen on a display showing the time entered. The time range has to be from 0-600 seconds in 0.01 second increments (600.00). From the information given, counters will be needed to design and build this circuit. A counter, in it s simplest form, is a group of flip flops that can temporarily store bits of information put into the circuit. They can be constructed in many different ways, such as in 4 flip flops (4-bit counter) or 8 flip flops and even higher. Counters are usually cascaded with other counters to reach higher bits, such as 16 or 24 bit counters. The application in which I will use the counters will be to count down from any programmable number that I input either by a keyboard or a thumbwheel. Also, I will use counters that will be used specifically as a frequency divider to divide the pulses that enter the circuit through an input signal from a crystal clock. The pulses will need to be divided so that it will function as a 100Hz clock putting out 100 pulses per second. A switch will be used to load my inputs in and more than likely a button also so that I can stop and hold the count at any point of time. I will use 5 BCD up/down programmable counters, and a certain amount (depending on what kind of "divide by N" counter I use) of frequency dividing counters for the assignment. After the design is carefully made, a task order will be written and then given to the manufacturer to create a rack mount circuit board that will match my specifications given. The applications in which this design will be used for is in the use of the six-component balance signal conditioner for measurement and electronic system control. It can be used as a timer system for the balance signal conditioner in which it does numerous tests for the Wind tunnel research, in which a preset time can be set for how long it performs its tests. Specifically, my design should be applied to the balance signal conditioner used for the 8x6 wind tunnel research. Hopefully this design should aid in more efficient research for the 8x6 wind tunnel.

  18. Wireless sensor node for detection of freight train derailment

    NASA Astrophysics Data System (ADS)

    Costa, Andrea; Milani, Damiano; Resta, Ferruccio; Tomasini, Gisella

    2016-04-01

    The target of the research activity presented in this paper is to design, to realize and to test an autonomous sensor node able to measure the accelerations in correspondence of the axle box of a freight train. The final goal of the sensor is to identify the derailment conditions by observing the variations in the spectra of the box accelerations, around the frequencies associated to the wheel revolution and its multiples. The sensor node embeds an accelerometer, a microprocessor, a transmission system, a piezoelectric bimorph energy harvester and an integrated circuit for managing the power distribution to each component of the node. In particular, a mechanical filter to be applied to the node was specifically designed to increment the energy recovered by the harvester and to filter out the high frequency components of the axle-box acceleration, allowing the use of a more sensitive accelerometer. The harvesting system was setup by means of laboratory tests carried out with an electromechanical shaker and the sensor node was finally tested through field tests on freight trains.

  19. Procedures for Instructional Systems Development

    DTIC Science & Technology

    1981-09-18

    single faults to the circuit and components level. (JTI Task No. TCB-01). Figure III-ll.--Example of a Module Page of a Curriculum Outline. 3 - 80...semiconductor trapezoidal wave generator circuit , multimeter, and oscilloscope measure the output amplitude, rise time, and jump voltage within +/- 10...accuracy. Given a trainer having a semiconductor trapezoidal wave generator circuit , multimeter, and oscilloscope - CONDITION (C) . measure the output

  20. Analog Module Architecture for Space-Qualified Field-Programmable Mixed-Signal Arrays

    NASA Technical Reports Server (NTRS)

    Edwards, R. Timothy; Strohbehn, Kim; Jaskulek, Steven E.; Katz, Richard

    1999-01-01

    Spacecraft require all manner of both digital and analog circuits. Onboard digital systems are constructed almost exclusively from field-programmable gate array (FPGA) circuits providing numerous advantages over discrete design including high integration density, high reliability, fast turn-around design cycle time, lower mass, volume, and power consumption, and lower parts acquisition and flight qualification costs. Analog and mixed-signal circuits perform tasks ranging from housekeeping to signal conditioning and processing. These circuits are painstakingly designed and built using discrete components due to a lack of options for field-programmability. FPAA (Field-Programmable Analog Array) and FPMA (Field-Programmable Mixed-signal Array) parts exist but not in radiation-tolerant technology and not necessarily in an architecture optimal for the design of analog circuits for spaceflight applications. This paper outlines an architecture proposed for an FPAA fabricated in an existing commercial digital CMOS process used to make radiation-tolerant antifuse-based FPGA devices. The primary concerns are the impact of the technology and the overall array architecture on the flexibility of programming, the bandwidth available for high-speed analog circuits, and the accuracy of the components for high-performance applications.

  1. BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability. Ph.D. Thesis

    NASA Technical Reports Server (NTRS)

    Chen, Chung-Hsing

    1992-01-01

    In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

  2. ELECTRICAL CIRCUITS USING COLD-CATHODE TRIODE VALVES

    DOEpatents

    Goulding, F.S.

    1957-11-26

    An electrical circuit which may be utilized as a pulse generator or voltage stabilizer is presented. The circuit employs a cold-cathode triode valve arranged to oscillate between its on and off stages by the use of selected resistance-capacitance time constant components in the plate and trigger grid circuits. The magnitude of the d-c voltage applied to the trigger grid circuit effectively controls the repetition rate of the output pulses. In the voltage stabilizer arrangement the d-c control voltage is a portion of the supply voltage and the rectified output voltage is substantially constant.

  3. Design and Analysis of Hydrostatic Transmission System

    NASA Astrophysics Data System (ADS)

    Mistry, Kayzad A.; Patel, Bhaumikkumar A.; Patel, Dhruvin J.; Parsana, Parth M.; Patel, Jitendra P.

    2018-02-01

    This study develops a hydraulic circuit to drive a conveying system dealing with heavy and delicate loads. Various safety circuits have been added in order to ensure stable working at high pressure and precise controlling. Here we have shown the calculation procedure based on an arbitrarily selected load. Also the circuit design and calculations of various components used is depicted along with the system simulation. The results show that the system is stable and efficient enough to transmit heavy loads by functioning of the circuit. By this information, one can be able to design their own hydrostatic circuits for various heavy loading conditions.

  4. Fast, Low-Power, Hysteretic Level-Detector Circuit

    NASA Technical Reports Server (NTRS)

    Arditti, Mordechai

    1993-01-01

    Circuit for detection of preset levels of voltage or current intended to replace standard fast voltage comparator. Hysteretic analog/digital level detector operates at unusually low power with little sacrifice of speed. Comprises low-power analog circuit and complementary metal oxide/semiconductor (CMOS) digital circuit connected in overall closed feedback loop to decrease rise and fall times, provide hysteresis, and trip-level control. Contains multiple subloops combining linear and digital feedback. Levels of sensed signals and hysteresis level easily adjusted by selection of components to suit specific application.

  5. Microterminal/Microfiche System for Computer-Based Instruction: Hardware and Software Development.

    DTIC Science & Technology

    1980-10-01

    Circuit Description and Schematic of Adaptor Module 57 Appendix C Circuit Description The schematics for circuitry used in the microfiche viewer and the...composed of four major components and associated interfaces. The major components are (a) mirroterminal. (Is) microfiche reader. (0) memory module , and (d...sensing of the position of the platen containing the microfiche so that frame locations can be verified by the microterminal software. The memory module is

  6. Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

    NASA Technical Reports Server (NTRS)

    Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

    2003-01-01

    The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

  7. Long life assurance study for manned spacecraft long life hardware. Volume 4: Special long life assurance studies

    NASA Technical Reports Server (NTRS)

    1972-01-01

    Guidelines for the selection of equipment to be used for manned spacecraft in order to assure a five year maintenance-free service life were developed. A special study was conducted to determine the adequacy of the procedures used to determine the quality and effectiveness of various components. The subjects examined are: (1) temperature cycling for acceptance of electronic assemblies; (2) accelerated testing techniques; (3) electronic part screening techniques; (4) electronic part derating practices; (5) vibration life extension of printed circuit board assemblies; and (6) tolerance funnelling and test requirements.

  8. Silicon-controlled-rectifier square-wave inverter with protection against commutation failure

    NASA Technical Reports Server (NTRS)

    Birchenough, A. G.

    1971-01-01

    The square-wave SCR inverter that was designed, built, and tested includes a circuit to turn off the inverter in case of commutation failure. The basic power stage is a complementary impulse-commutated parallel inverter consisting of only six components. The 400-watt breadboard was tested while operating at + or - 28 volts, and it had a peak efficiency of 95.5 percent at 60 hertz and 91.7 percent at 400 hertz. The voltage regulation for a fixed input was 3 percent at 60 hertz. An analysis of the operation and design information is included.

  9. Sensor/amplifier for weak light sources

    NASA Technical Reports Server (NTRS)

    Desmet, D. J.; Jason, A. J.; Parr, A. C.

    1980-01-01

    Light sensor/amplifier circuit detects weak light converts it into strong electrical signal in electrically noisy environment. Circuit is relatively simple and uses inexpensive, readily available components. Device is useful in such applications as fire detection and photographic processing.

  10. Modular design of synthetic gene circuits with biological parts and pools.

    PubMed

    Marchisio, Mario Andrea

    2015-01-01

    Synthetic gene circuits can be designed in an electronic fashion by displaying their basic components-Standard Biological Parts and Pools of molecules-on the computer screen and connecting them with hypothetical wires. This procedure, achieved by our add-on for the software ProMoT, was successfully applied to bacterial circuits. Recently, we have extended this design-methodology to eukaryotic cells. Here, highly complex components such as promoters and Pools of mRNA contain hundreds of species and reactions whose calculation demands a rule-based modeling approach. We showed how to build such complex modules via the joint employment of the software BioNetGen (rule-based modeling) and ProMoT (modularization). In this chapter, we illustrate how to utilize our computational tool for synthetic biology with the in silico implementation of a simple eukaryotic gene circuit that performs the logic AND operation.

  11. Semi-Automated Diagnosis, Repair, and Rework of Spacecraft Electronics

    NASA Technical Reports Server (NTRS)

    Struk, Peter M.; Oeftering, Richard C.; Easton, John W.; Anderson, Eric E.

    2008-01-01

    NASA's Constellation Program for Exploration of the Moon and Mars places human crews in extreme isolation in resource scarce environments. Near Earth, the discontinuation of Space Shuttle flights after 2010 will alter the up- and down-mass capacity for the International Space Station (ISS). NASA is considering new options for logistics support strategies for future missions. Aerospace systems are often composed of replaceable modular blocks that minimize the need for complex service operations in the field. Such a strategy however, implies a robust and responsive logistics infrastructure with relatively low transportation costs. The modular Orbital Replacement Units (ORU) used for ISS requires relatively large blocks of replacement hardware even though the actual failed component may really be three orders of magnitude smaller. The ability to perform in-situ repair of electronics circuits at the component level can dramatically reduce the scale of spares and related logistics cost. This ability also reduces mission risk, increases crew independence and improves the overall supportability of the program. The Component-Level Electronics Assembly Repair (CLEAR) task under the NASA Supportability program was established to demonstrate the practicality of repair by first investigating widely used soldering materials and processes (M&P) performed by modest manual means. The work will result in program guidelines for performing manual repairs along with design guidance for circuit reparability. The next phase of CLEAR recognizes that manual repair has its limitations and some highly integrated devices are extremely difficult to handle and demand semi-automated equipment. Further, electronics repairs require a broad range of diagnostic capability to isolate the faulty components. Finally repairs must pass functional tests to determine that the repairs are successful and the circuit can be returned to service. To prevent equipment demands from exceeding spacecraft volume capacity and skill demands from exceeding crew time and training limits, the CLEAR project is examining options provided by non-real time tele-operations, robotics, and a new generation of diagnostic equipment. This paper outlines a strategy to create an effective repair environment where, with the support of ground based engineers, crewmembers can diagnose, repair and test flight electronics in-situ. This paper also discusses the implications of successful tele-robotic repairs when expanded to rework and reconfiguration of used flight assets for building Constellation infrastructure elements.

  12. Development of Electronics for Low-Temperature Space Missions

    NASA Technical Reports Server (NTRS)

    Patterson, Richard L.; Hammoud, Ahmad; Dickman, John E.; Gerber, Scott S.; Overton, Eric

    2001-01-01

    Electronic systems that are capable of operating at cryogenic temperatures will be needed for many future NASA space missions, including deep space probes and spacecraft for planetary surface exploration. In addition to being able to survive the harsh deep space environment, low-temperature electronics would help improve circuit performance, increase system efficiency, and reduce payload development and launch costs. Terrestrial applications where components and systems must operate in low-temperature environments include cryogenic instrumentation, superconducting magnetic energy storage, magnetic levitation transportation systems, and arctic exploration. An ongoing research and development project for the design, fabrication, and characterization of low-temperature electronics and supporting technologies at NASA Glenn Research Center focuses on efficient power systems capable of surviving in and exploiting the advantages of low-temperature environments. Supporting technologies include dielectric and insulating materials, semiconductor devices, passive power components, optoelectronic devices, and packaging and integration of the developed components into prototype flight hardware. An overview of the project is presented, including a description of the test facilities, a discussion of selected data from component testing, and a presentation of ongoing research activities being performed in collaboration with various organizations.

  13. Electronic Components and Systems for Cryogenic Space Applications

    NASA Technical Reports Server (NTRS)

    Patterson, R. L.; Hammoud, A.; Dickman, J. E.; Gerber, S.; Elbuluk, M. E.; Overton, E.

    2001-01-01

    Electronic components and systems capable of operation at cryogenic temperatures are anticipated in many future NASA space missions such as deep space probes and planetary surface exploration. For example, an unheated interplanetary probe launched to explore the rings of Saturn would reach an average temperature near Saturn of about - 183 C. In addition to surviving the deep space harsh environment, electronics capable of low temperature operation would contribute to improving circuit performance, increasing system efficiency, and reducing payload development and launch costs. Terrestrial applications where components and systems must operate in low temperature environments include cryogenic instrumentation, superconducting magnetic energy storage, magnetic levitation transportation system, and arctic exploration. An on-going research and development program at the NASA Glenn Research Center focuses on the development of reliable electronic devices and efficient power systems capable of surviving in low temperature environments. An overview of the program will be presented in this paper. A description of the low temperature test facilities along with selected data obtained from in-house component testing will also be discussed. Ongoing research activities that are being performed in collaboration with various organizations will also be presented.

  14. The differential mice response to cat and snake odor.

    PubMed

    de Oliveira Crisanto, Karen; de Andrade, Wylqui Mikael Gomes; de Azevedo Silva, Kayo Diogenes; Lima, Ramón Hypolito; de Oliveira Costa, Miriam Stela Maris; de Souza Cavalcante, Jeferson; de Lima, Ruthnaldo Rodrigues Melo; do Nascimento, Expedito Silva; Cavalcante, Judney Cley

    2015-12-01

    Studies from the last two decades have pointed to multiple mechanisms of fear. For responding to predators, there is a group of highly interconnected hypothalamic nuclei formed by the anterior hypothalamic nucleus, the ventromedial hypothalamic nucleus and the dorsal premammillary nucleus—the predator-responsive hypothalamic circuit. This circuit expresses Fos in response to predator presence or its odor. Lesion of any component of this system blocks or reduces the expression of fear and consequently defensive behavior when faced with a predator or its cue. However, most of the knowledge about that circuit has been obtained using the rat as a model of prey and the cat as a source of predator cues. In the present study, we exposed mice to strong cat or snake odors, two known mice predators, and then we used the rat exposure test (RET) to study their behavior when confronted with the same predator's odor. Our data point to a differential response of mice exposed to these odors. When Swiss mice were exposed to the cat odor, they show defensive behavior and the predator-responsive hypothalamic circuit expressed Fos. The opposite was seen when they faced snake's odor. The acute odor exposure was not sufficient to activate the mouse predator-responsive hypothalamic circuit and the mice acted like they were not in a stressful situation, showing almost no sign of fear or defensive posture. This leads us to the conclusion that not all the predator cues are sufficient to activate the predator-responsive hypothalamic circuit of mice and that their response depends on the danger that these predators represent in the natural history of the prey.

  15. Clinical evaluation of the Novacor totally implantable ventricular assist system. Current status.

    PubMed

    Daniel, M A; Lee, J; LaForge, D H; Chen, H; Billich, J; Miller, P J; Ramasamy, N; Strauss, L R; Jassawalla, J S; Portner, P M

    1991-01-01

    The totally implantable Novacor left ventricular assist system (LVAS) is currently approaching clinical evaluation. In vivo testing and production are underway with National Institutes of Health (NIH) support. Activity over the past year has focused on manufacturing engineering, preproduction quality assurance, and in vivo experiment completion. Subsequent to successful completion of the NIH-sponsored, 2-year preclinical device readiness test (DRT), a number of refinements were identified and approved by the NIH technical/data review board. Most of these were necessitated by obsolescence or unavailability of electronic components and the decision to use only high reliability military (MIL) qualified electronic components and processes. A few additional refinements were identified to increase design margins, all of which were qualified by accelerated testing. The development of production processes, automated test programs, and MIL compliant environmental stress screening procedures was completed. Production of LVAS subsystems, including core electronic components (hybrids, application-specific integrated circuits, and surface mount boards), was initiated. Animal studies are underway. The clinical trial, at Presbyterian-University Hospital of Pittsburgh and St. Louis University Medical Center, awaits completion of in vivo experiments, protocol development, and Food and Drug Administration approval.

  16. Adaptive noise reduction circuit for a sound reproduction system

    NASA Technical Reports Server (NTRS)

    Engebretson, A. Maynard (Inventor); O'Connell, Michael P. (Inventor)

    1995-01-01

    A noise reduction circuit for a hearing aid having an adaptive filter for producing a signal which estimates the noise components present in an input signal. The circuit includes a second filter for receiving the noise-estimating signal and modifying it as a function of a user's preference or as a function of an expected noise environment. The circuit also includes a gain control for adjusting the magnitude of the modified noise-estimating signal, thereby allowing for the adjustment of the magnitude of the circuit response. The circuit also includes a signal combiner for combining the input signal with the adjusted noise-estimating signal to produce a noise reduced output signal.

  17. Reusable vibration resistant integrated circuit mounting socket

    DOEpatents

    Evans, Craig N.

    1995-01-01

    This invention discloses a novel form of socket for integrated circuits to be mounted on printed circuit boards. The socket uses a novel contact which is fabricated out of a bimetallic strip with a shape which makes the end of the strip move laterally as temperature changes. The end of the strip forms a barb which digs into an integrated circuit lead at normal temperatures and holds it firmly in the contact, preventing loosening and open circuits from vibration. By cooling the contact containing the bimetallic strip the barb end can be made to release so that the integrated circuit lead can be removed from the socket without damage either to the lead or to the socket components.

  18. Monolithic FET structures for high-power control component applications

    NASA Astrophysics Data System (ADS)

    Shifrin, Mitchell B.; Katzin, Peter J.; Ayasli, Yalcin

    1989-12-01

    A monolithic FET switch is described that can be integrated with other monolithic functions or used as a discrete component in a microwave integrated circuit structure. This device increases the power-handling capability of the conventional single FET switch by an order of magnitude. It does this by overcoming the breakdown voltage limitation of the FET device. The design, fabrication, and performance of two high-power control components using these circuits are described as examples of the implementation of this technology. They are an L-band terminated single-pole, single-throw (SPST) switch and an L-band limiter).

  19. VHDL Simulation of the Implementation of a Costfunction Circuit.

    DTIC Science & Technology

    1990-09-01

    the characteristic delays for each component. At this point in time, it is not necessary for the VHDL code to implement the exact hardware...NAVAL POSTGRADUATE SCHOOL Monterey, California AD-A240 430 ,DSTATv, OTIC"b El FCTE 9% SEP 16 1991 ru m D THESIS VHDL Simulation of the Implementation ...partition algorithm is used here as an example to test the VHDL design methodology. Subroutines or statements in the software can be implemented into

  20. Operational considerations of the Advanced Photovoltaic Solar Array

    NASA Technical Reports Server (NTRS)

    Stella, Paul M.; Kurland, Richard M.

    1992-01-01

    Issues affecting the long-term operational performance of the Advanced Photovoltaic Solar Array (APSA) are discussed, with particular attention given to circuit electrical integrity from shadowed and cracked cell modules. The successful integration of individual advanced array components provides a doubling of array specific performance from the previous NASA-developed advanced array (SAFE). Flight test modules both recently fabricated and under fabrication are described. The development of advanced high-performance blanket technology for future APSA enhancement is presented.

  1. Operational considerations of the Advanced Photovoltaic Solar Array

    NASA Astrophysics Data System (ADS)

    Stella, Paul M.; Kurland, Richard M.

    Issues affecting the long-term operational performance of the Advanced Photovoltaic Solar Array (APSA) are discussed, with particular attention given to circuit electrical integrity from shadowed and cracked cell modules. The successful integration of individual advanced array components provides a doubling of array specific performance from the previous NASA-developed advanced array (SAFE). Flight test modules both recently fabricated and under fabrication are described. The development of advanced high-performance blanket technology for future APSA enhancement is presented.

  2. An electronic circuit for sensing malfunctions in test instrumentation

    NASA Technical Reports Server (NTRS)

    Miller, W. M., Jr.

    1969-01-01

    Monitoring device differentiates between malfunctions occurring in the system undergoing test and malfunctions within the test instrumentation itself. Electronic circuits in the monitor use transistors to commutate silicon controlled rectifiers by removing the drive voltage, display circuits are then used to monitor multiple discrete lines.

  3. Majority-voted logic fail-sense circuit

    NASA Technical Reports Server (NTRS)

    Mclyman, W. T.

    1977-01-01

    Fail-sense circuit has majority-voted logic component which receives three error voltage signals that are sensed at single point by three error amplifiers. If transistor shorts, only one signal is required to operate; if transistor opens, two signals are required.

  4. Fault Detection, Isolation and Recovery (FDIR) Portable Liquid Oxygen Hardware Demonstrator

    NASA Technical Reports Server (NTRS)

    Oostdyk, Rebecca L.; Perotti, Jose M.

    2011-01-01

    The Fault Detection, Isolation and Recovery (FDIR) hardware demonstration will highlight the effort being conducted by Constellation's Ground Operations (GO) to provide the Launch Control System (LCS) with system-level health management during vehicle processing and countdown activities. A proof-of-concept demonstration of the FDIR prototype established the capability of the software to provide real-time fault detection and isolation using generated Liquid Hydrogen data. The FDIR portable testbed unit (presented here) aims to enhance FDIR by providing a dynamic simulation of Constellation subsystems that feed the FDIR software live data based on Liquid Oxygen system properties. The LO2 cryogenic ground system has key properties that are analogous to the properties of an electronic circuit. The LO2 system is modeled using electrical components and an equivalent circuit is designed on a printed circuit board to simulate the live data. The portable testbed is also be equipped with data acquisition and communication hardware to relay the measurements to the FDIR application running on a PC. This portable testbed is an ideal capability to perform FDIR software testing, troubleshooting, training among others.

  5. USSR and Eastern Europe Scientific Abstracts, Electronics and Electrical Engineering, Number 27

    DTIC Science & Technology

    1977-02-10

    input and output conditions. The power section of the circuit is modified to permit triacs and thyristors, respectively, to function. The purpose of the...electronic materials, components, and devices, on circuit theory, pulse techniques, electromagnetic wave propagation, radar, quantum electronic theory...Lasers, Masers, Holography, Quasi-Optical 20 Microelectronics and General Circuit Theory and Information 21 Radars and Radio Wavigati on 22

  6. Gallium arsenide pilot line for high performance components

    NASA Astrophysics Data System (ADS)

    1990-01-01

    The Gallium Arsenide Pilot Line for High Performance Components (Pilot Line III) is to develop a facility for the fabrication of GaAs logic and memory chips. The first thirty months of this contract are now complete, and this report covers the period from March 27 through September 24, 1989. Similar to the PT-2M SRAM function for memories, the six logic circuits of PT-2L and PT-2M have served their functions as stepping stones toward the custom, standard cell, and cell array logic circuits. All but one of these circuits was right first time; the remaining circuit had a layout error due to a bug in the design rule checker that has since been fixed. The working devices all function over the full temperature range from -55 to 125 C. They all comfortably meet the 200 MHz requirement. They do not solidly conform to the required input and output voltage levels, particularly Vih. It is known that these circuits were designed with the older design models and that they came from an era where the DFET thresholds were often not on target.

  7. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator in... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 56.6407 Section 56.6407... SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Explosives Electric...

  8. Test and evaluation of load converter topologies used in the Space Station Freedom power management and distribution dc test bed

    NASA Technical Reports Server (NTRS)

    Lebron, Ramon C.; Oliver, Angela C.; Bodi, Robert F.

    1991-01-01

    Power components hardware in support of the Space Station freedom dc Electric Power System were tested. One type of breadboard hardware tested is the dc Load Converter Unit, which constitutes the power interface between the electric power system and the actual load. These units are dc to dc converters that provide the final system regulation before power is delivered to the load. Three load converters were tested: a series resonant converter, a series inductor switch-mode converter, and a switching full-bridge forward converter. The topology, operation principles, and test results are described, in general. A comparative analysis of the three units is given with respect to efficiency, regulation, short circuit behavior (protection), and transient characteristics.

  9. Potential for integrated optical circuits in advanced aircraft with fiber optic control and monitoring systems

    NASA Astrophysics Data System (ADS)

    Baumbick, Robert J.

    1991-02-01

    Fiber optic technology is expected to be used in future advanced weapons platforms as well as commercial aerospace applications. Fiber optic waveguides will be used to transmit noise free high speed data between a multitude of computers as well as audio and video information to the flight crew. Passive optical sensors connected to control computers with optical fiber interconnects will serve both control and monitoring functions. Implementation of fiber optic technology has already begun. Both the military and NASA have several programs in place. A cooperative program called FOCSI (Fiber Optic Control System Integration) between NASA Lewis and the NAVY to build environmentally test and flight demonstrate sensor systems for propul sion and flight control systems is currently underway. Integrated Optical Circuits (IOC''s) are also being given serious consideration for use in advanced aircraft sys tems. IOC''s will result in miniaturization and localization of components to gener ate detect optical signals and process them for use by the control computers. In some complex systems IOC''s may be required to perform calculations optically if the technology is ready replacing some of the electronic systems used today. IOC''s are attractive because they will result in rugged components capable of withstanding severe environments in advanced aerospace vehicles. Manufacturing technology devel oped for microelectronic integrated circuits applied to IOC''s will result in cost effective manufacturing. This paper reviews the current FOCSI program and describes the role of IOC''s in FOCSI applications.

  10. Measuring Accurately Single-Phase Sinusoidal and Non-Sinusoidal Power.

    DTIC Science & Technology

    1983-01-01

    current component. Since the induction watthour meter is designed for measuring ac variations only, the creation of a dc component in an ac circuit due...available and the basic principle of measurement used in each. 3.1 Power Measuring Meters Instruments designed to measure the amount of average power...1.0 percent of full scale and + 0.5% of reading. 3.2 Encrgy Measuring Meters Instruments designed to measure the amount of power consumed in a circuit

  11. Application of Novel Anion-Exchange Blend Membranes (AEBMs) to Vanadium Redox Flow Batteries.

    PubMed

    Cho, Hyeongrae; Krieg, Henning M; Kerres, Jochen A

    2018-06-19

    Both cation-exchange membranes and anion-exchange membranes are used as ion conducting membranes in vanadium redox flow batteries (VRFBs). Anion-exchange membranes (AEMs) are applied in vanadium redox flow batteries due to the high blocking property of vanadium ions via the Donnan exclusion effect. In this study, novel anion-exchange blend membranes (AEBMs) were prepared, characterized, and applied in VRFBs. Bromomethylated poly(2,6-dimethyl-1,4-phenylene oxide), poly[(1-(4,4′-diphenylether)-5-oxybenzimidazole)-benzimidazole] (PBI-OO) and sulfonated polyether sulfone polymer were combined to prepare 3-component AEBMs with 1,2,4,5-tetramethylimidazole (TMIm) for quaternization. 3-component AEBMs showed significantly enhanced chemical and mechanical properties compared with those of 2-component AEBMs, resulting in an improved performance in VRFBs. The compositions of the anion-exchange polymers in 3-component AEBMs were systematically varied to optimize the AEBMs for the redox-flow battery application. While the 3-component AEBMs showed comparable efficiencies with Nafion ® 212 membranes, they displayed improved vanadium ions cross-over as was confirmed by open circuit voltage tests and capacity fade tests conducted in VRFBs. In addition, one of the synthesized 3-component AEBM had a superior coulombic efficiency and capacity retention in a charging⁻discharging test over 300 cycles at a current density of 40 mA/cm². It can thus be concluded that 3-component AEBMs are promising candidates for long-term operation in VRFBs.

  12. NASA Tech Briefs, July 1997. Volume 21, No. 7

    NASA Technical Reports Server (NTRS)

    1997-01-01

    Topics: Mechanical Components; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Software; Mechanics; Machinery/Automation; Manufacturing/Fabrication; Life Sciences.

  13. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... current circuits serving three-phase alternating current equipment and their auxiliary devices shall be... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and...

  14. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... current circuits serving three-phase alternating current equipment and their auxiliary devices shall be... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and...

  15. Ergonomics improvements of the visual inspection process in a printed circuit assembly factory.

    PubMed

    Yeow, Paul H P; Sen, Rabindra Nath

    2004-01-01

    An ergonomics improvement study was conducted on the visual inspection process of a printed circuit assembly (PCA) factory. The process was studied through subjective assessment and direct observation. Three problems were identified: operators' eye problems, insufficient time for inspection and ineffective visual inspection. These problems caused a huge yearly rejection cost of US 298,240 dollars, poor quality, customer dissatisfaction and poor occupational health and safety. Ergonomics interventions were made to rectify the problems: reduced usage of a magnifying glass, the use of less glaring inspection templates, inspection of only electrically non-tested components and introduction of a visual inspection sequence. The interventions produced savings in rejection cost, reduced operators' eye strain, headaches and watery eyes, lowered the defect percentage at customers' sites and increased the factory's productivity and customer satisfaction.

  16. Evaluation of advanced microelectronic fluxless solder-bump contacts for hybrid microcircuits

    NASA Technical Reports Server (NTRS)

    Mandal, R. P.

    1976-01-01

    Technology for interconnecting monolithic integrated circuit chips with other components is investigated. The advantages and disadvantages of the current flip-chip approach as compared to other interconnection methods are outlined. A fluxless solder-bump contact technology is evaluated. Multiple solder-bump contacts were formed on silicon integrated circuit chips. The solder-bumps, comprised of a rigid nickel under layer and a compliant solder overlayer, were electroformed onto gold device pads with the aid of thick dry film photomasks. Different solder alloys and the use of conductive epoxy for bonding were explored. Fluxless solder-bump bond quality and reliability were evaluated by measuring the effects of centrifuge, thermal cycling, and high temperature storage on bond visual characteristics, bond electrical continuity, and bond shear tests. The applicability and suitability of this technology for hybrid microelectronic packaging is discussed.

  17. Effect of notch depth of modified current collector on internal-short-circuit mitigation for lithium-ion battery

    NASA Astrophysics Data System (ADS)

    Wang, Meng; Noelle, Daniel J.; Shi, Yang; Le, Anh V.; Qiao, Yu

    2018-01-01

    Formation of internal short circuit (ISC) may result in catastrophic thermal runaway of lithium-ion battery (LIB). Among LIB cell components, direct contact between cathode and anode current collectors is most critical to the ISC behavior, yet is still relatively uninvestigated. In the current study, we analyze the effect of heterogeneity of current collector on the temperature increase of LIB cells subjected to mechanical abuse. The cathode current collector is modified by surface notches, so that it becomes effectively brittle and the ISC site can be isolated. Results from impact tests on LIB cells with modified current collectors suggest that their temperature increase can be negligible. The critical parameters include the failure strain and the failure work of modified current collector, both of which are related to the notch depth.

  18. Method and Circuit for In-Situ Health Monitoring of Solar Cells in Space

    NASA Technical Reports Server (NTRS)

    Krasowski, Michael J.; Prokop, Norman F.

    2010-01-01

    This innovation represents a method and circuit realization of a system designed to make in-situ measurements of test solar-cell operational parameters on orbit using readily available high-temperature and high-ionizing-radiation- tolerant electronic components. This innovation enables on-orbit in-situ solar-array health monitoring and is in response to a need recognized by the U.S. Air Force for future solar arrays for unmanned spacecraft. This system can also be constructed out of commercial-grade electronics and can be embedded into terrestrial solar power system as a diagnostics instrument. This innovation represents a novel approach to I-V curve measurement that is radiation and temperature hard, consumes very few system resources, is economical, and utilizes commercially available components. The circuit will also operate at temperatures as low as 55 C and up to +225 C, allowing it to reside close to the array in direct sunlight. It uses a swept mode transistor functioning as a resistive load while utilizing the solar cells themselves as the biasing device, so the size of the instrument is small and there is no danger of over-driving the cells. Further, this innovation utilizes nearly universal spacecraft bus resources and therefore can be readily adapted to any spacecraft bus allowing for ease of retrofit, or designed into new systems without requiring the addition of infrastructure. One unique characteristic of this innovation is that it effects the measurement of I-V curves without the use of large resistor arrays or active current sources normally used to characterize cells. A single transistor is used as a variable resistive load across the cell. This multi-measurement instrument was constructed using operational amplifiers, analog switches, voltage regulators, MOSFETs, resistors, and capacitors. The operational amplifiers, analog switches, and voltage regulators are silicon-on-insulator (SOI) technology known for its hardness to the effects of ionizing radiation. The SOI components used can tolerate temperatures up to 225 C, which gives plenty of thermal headroom allowing this circuit to perhaps reside in the solar cell panel itself where temperatures can reach over 100 C.

  19. High frequency capacitor-diode voltage multiplier dc-dc converter development

    NASA Technical Reports Server (NTRS)

    Kisch, J. J.; Martinelli, R. M.

    1977-01-01

    A power conditioner was developed which used a capacitor diode voltage multiplier to provide a high voltage without the use of a step-up transformer. The power conditioner delivered 1200 Vdc at 100 watts and was operated from a 120 Vdc line. The efficiency was in excess of 90 percent. The component weight was 197 grams. A modified boost-add circuit was used for the regulation. A short circuit protection circuit was used which turns off the drive circuit upon a fault condition, and recovers within 5 ms after removal of the short. High energy density polysulfone capacitors and high speed diodes were used in the multiplier circuit.

  20. Four-to-one power combiner for 20 GHz phased array antenna using RADC MMIC phase shifters

    NASA Technical Reports Server (NTRS)

    1991-01-01

    The design and microwave simulation of two-to-one microstrip power combiners is described. The power combiners were designed for use in a four element phase array receive antenna subarray at 20 GHz. Four test circuits are described which were designed to enable testing of the power combiner and the four element phased array antenna. Test Circuit 1 enables measurement of the two-to-one power combiner. Test Circuit 2 enables measurement of the four-to-one power combiner. Test Circuit 3 enables measurement of a four element antenna array without phase shifting MMIC's in order to characterize the power combiner with the antenna patch-to-microstrip coaxial feedthroughs. Test circuit 4 is the four element phased array antenna including the RADC MMIC phase shifters and appropriate interconnects to provide bias voltages and control phase bits.

  1. Microphotonic devices for compact planar lightwave circuits and sensor systems

    NASA Astrophysics Data System (ADS)

    Cardenas Gonzalez, Jaime

    2005-07-01

    Higher levels of integration in planar lightwave circuits and sensor systems can reduce fabrication costs and broaden viable applications for optical network and sensor systems. For example, increased integration and functionality can lead to sensor systems that are compact enough for easy transport, rugged enough for field applications, and sensitive enough even for laboratory applications. On the other hand, more functional and compact planar lightwave circuits can make optical networks components less expensive for the metro and access markets in urban areas and allow penetration of fiber to the home. Thus, there is an important area of opportunity for increased integration to provide low cost, compact solutions in both network components and sensor systems. In this dissertation, a novel splitting structure for microcantilever deflection detection is introduced. The splitting structure is designed so that its splitting ratio is dependent on the vertical position of the microcantilever. With this structure, microcantilevers sensitized to detect different analytes or biological agents can be integrated into an array on a single chip. Additionally, the integration of a depolarizer into the optoelectronic integrated circuit in an interferometric fiber optic gyroscope is presented as a means for cost reduction. The savings come in avoiding labor intensive fiber pigtailing steps by permitting batch fabrication of these components. In particular, this dissertation focuses on the design of the waveguides and polarization rotator, and the impact of imperfect components on the performance of the depolarizer. In the area of planar lightwave circuits, this dissertation presents the development of a fabrication process for single air interface bends (SAIBs). SAIBs can increase integration by reducing the area necessary to make a waveguide bend. Fabrication and measurement of a 45° SAIB with a bend efficiency of 93.4% for TM polarization and 92.7% for TE polarization are presented.

  2. GATING CIRCUITS

    DOEpatents

    Merrill, L.C.

    1958-10-14

    Control circuits for vacuum tubes are described, and a binary counter having an improved trigger circuit is reported. The salient feature of the binary counter is the application of the input signal to the cathode of each of two vacuum tubes through separate capacitors and the connection of each cathode to ground through separate diodes. The control of the binary counter is achieved in this manner without special pulse shaping of the input signal. A further advantage of the circuit is the simplicity and minimum nuruber of components required, making its use particularly desirable in computer machines.

  3. Circuit-level optimisation of a:Si TFT-based AMOLED pixel circuits for maximum hold current

    NASA Astrophysics Data System (ADS)

    Foroughi, Aidin; Mehrpoo, Mohammadreza; Ashtiani, Shahin J.

    2013-11-01

    Design of AMOLED pixel circuits has manifold constraints and trade-offs which provides incentive for circuit designers to seek optimal solutions for different objectives. In this article, we present a discussion on the viability of an optimal solution to achieve the maximum hold current. A compact formula for component sizing in a conventional 2T1C pixel is, therefore, derived. Compared to SPICE simulation results, for several pixel sizes, our predicted optimum sizing yields maximum currents with errors less than 0.4%.

  4. Graphene radio frequency receiver integrated circuit.

    PubMed

    Han, Shu-Jen; Garcia, Alberto Valdes; Oida, Satoshi; Jenkins, Keith A; Haensch, Wilfried

    2014-01-01

    Graphene has attracted much interest as a future channel material in radio frequency electronics because of its superior electrical properties. Fabrication of a graphene integrated circuit without significantly degrading transistor performance has proven to be challenging, posing one of the major bottlenecks to compete with existing technologies. Here we present a fabrication method fully preserving graphene transistor quality, demonstrated with the implementation of a high-performance three-stage graphene integrated circuit. The circuit operates as a radio frequency receiver performing signal amplification, filtering and downconversion mixing. All circuit components are integrated into 0.6 mm(2) area and fabricated on 200 mm silicon wafers, showing the unprecedented graphene circuit complexity and silicon complementary metal-oxide-semiconductor process compatibility. The demonstrated circuit performance allow us to use graphene integrated circuit to perform practical wireless communication functions, receiving and restoring digital text transmitted on a 4.3-GHz carrier signal.

  5. Simulation Approach for Timing Analysis of Genetic Logic Circuits.

    PubMed

    Baig, Hasan; Madsen, Jan

    2017-07-21

    Constructing genetic logic circuits is an application of synthetic biology in which parts of the DNA of a living cell are engineered to perform a dedicated Boolean function triggered by an appropriate concentration of certain proteins or by different genetic components. These logic circuits work in a manner similar to electronic logic circuits, but they are much more stochastic and hence much harder to characterize. In this article, we introduce an approach to analyze the threshold value and timing of genetic logic circuits. We show how this approach can be used to analyze the timing behavior of single and cascaded genetic logic circuits. We further analyze the timing sensitivity of circuits by varying the degradation rates and concentrations. Our approach can be used not only to characterize the timing behavior but also to analyze the timing constraints of cascaded genetic logic circuits, a capability that we believe will be important for design automation in synthetic biology.

  6. Graphene radio frequency receiver integrated circuit

    NASA Astrophysics Data System (ADS)

    Han, Shu-Jen; Garcia, Alberto Valdes; Oida, Satoshi; Jenkins, Keith A.; Haensch, Wilfried

    2014-01-01

    Graphene has attracted much interest as a future channel material in radio frequency electronics because of its superior electrical properties. Fabrication of a graphene integrated circuit without significantly degrading transistor performance has proven to be challenging, posing one of the major bottlenecks to compete with existing technologies. Here we present a fabrication method fully preserving graphene transistor quality, demonstrated with the implementation of a high-performance three-stage graphene integrated circuit. The circuit operates as a radio frequency receiver performing signal amplification, filtering and downconversion mixing. All circuit components are integrated into 0.6 mm2 area and fabricated on 200 mm silicon wafers, showing the unprecedented graphene circuit complexity and silicon complementary metal-oxide-semiconductor process compatibility. The demonstrated circuit performance allow us to use graphene integrated circuit to perform practical wireless communication functions, receiving and restoring digital text transmitted on a 4.3-GHz carrier signal.

  7. An extensible circuit QED architecture for quantum computation

    NASA Astrophysics Data System (ADS)

    Dicarlo, Leo

    Realizing a logical qubit robust to single errors in its constituent physical elements is an immediate challenge for quantum information processing platforms. A longer-term challenge will be achieving quantum fault tolerance, i.e., improving logical qubit resilience by increasing redundancy in the underlying quantum error correction code (QEC). In QuTech, we target these challenges in collaboration with industrial and academic partners. I will present the circuit QED quantum hardware, room-temperature control electronics, and software components of the complete architecture. I will show the extensibility of each component to the Surface-17 and -49 circuits needed to reach the objectives with surface-code QEC, and provide an overview of latest developments. Research funded by IARPA and Intel Corporation.

  8. Determining distance to lightning strokes from a single station

    NASA Technical Reports Server (NTRS)

    Ruhnke, L. H. (Inventor)

    1973-01-01

    Apparatus is described for determining the distance to lightning strokes from a single station. The apparatus includes a first loop antenna system for sensing the magnetic field produced by the lightning which is filtered, square rooted, and fed into a peak voltage holding circuit. A second antenna is provided for sensing the electric field produced by the lightning which is fed into a filter, an absolute value meter, and to a peak voltage holding circuit. A multivibrator gates the magnetic and electric signals through the peak holding circuits to a ratio meter which produces a signal corresponding to the ratio between the magnetic component and the electric component. The amplitude of this signal is proportional to the distance from the apparatus to the lightning stroke.

  9. Epoxy bond and stop etch fabrication method

    DOEpatents

    Simmons, Jerry A.; Weckwerth, Mark V.; Baca, Wes E.

    2000-01-01

    A class of epoxy bond and stop etch (EBASE) microelectronic fabrication techniques is disclosed. The essence of such techniques is to grow circuit components on top of a stop etch layer grown on a first substrate. The first substrate and a host substrate are then bonded together so that the circuit components are attached to the host substrate by the bonding agent. The first substrate is then removed, e.g., by a chemical or physical etching process to which the stop etch layer is resistant. EBASE fabrication methods allow access to regions of a device structure which are usually blocked by the presence of a substrate, and are of particular utility in the fabrication of ultrafast electronic and optoelectronic devices and circuits.

  10. Test results for SEU and SEL immune memory circuits

    NASA Technical Reports Server (NTRS)

    Wiseman, D.; Canaris, J.; Whitaker, S.; Gambles, J.; Arave, K.; Arave, L.

    1993-01-01

    Test results for three SEU logic/circuit hardened CMOS memory circuits verify upset and latch-up immunity for two configurations to be in excess of 120 MeV cm(exp 2)/mg using a commercial, non-radiation hardened CMOS process. Test chips from three separate fabrication runs in two different process were evaluated.

  11. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand flow...

  12. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand flow...

  13. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Testing, examination and maintenance of circuit breakers; procedures. 75.800-3 Section 75.800-3 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers...

  14. Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections

    PubMed Central

    Jeffery, A.; Elmquist, R. E.; Cage, M. E.

    1995-01-01

    Precision tests verify the dc equivalent circuit used by Ricketts and Kemeny to describe a quantum Hall effect device in terms of electrical circuit elements. The tests employ the use of cryogenic current comparators and the double-series and triple-series connection techniques of Delahaye. Verification of the dc equivalent circuit in double-series and triple-series connections is a necessary step in developing the ac quantum Hall effect as an intrinsic standard of resistance. PMID:29151768

  15. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in a... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and...

  16. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in a... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and...

  17. Photonic Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Krainak, Michael; Merritt, Scott

    2016-01-01

    Integrated photonics generally is the integration of multiple lithographically defined photonic and electronic components and devices (e.g. lasers, detectors, waveguides passive structures, modulators, electronic control and optical interconnects) on a single platform with nanometer-scale feature sizes. The development of photonic integrated circuits permits size, weight, power and cost reductions for spacecraft microprocessors, optical communication, processor buses, advanced data processing, and integrated optic science instrument optical systems, subsystems and components. This is particularly critical for small spacecraft platforms. We will give an overview of some NASA applications for integrated photonics.

  18. Band-Pass Amplifier Without Discrete Reactance Elements

    NASA Technical Reports Server (NTRS)

    Kleinberg, L.

    1984-01-01

    Inherent or "natural" device capacitance exploited. Band-Pass Circuit has input impedance of equivalent circuit at frequencies much greater than operational-amplifier rolloff frequency. Apparent inductance and capacitance arise from combined effects of feedback and reactive component of amplifier gain in frequency range.

  19. Abuse behavior of high-power, lithium-ion cells

    NASA Astrophysics Data System (ADS)

    Spotnitz, R.; Franklin, J.

    Published accounts of abuse testing of lithium-ion cells and components are summarized, including modeling work. From this summary, a set of exothermic reactions is selected with corresponding estimates of heats of reaction. Using this set of reactions, along with estimated kinetic parameters and designs for high-rate batteries, models for the abuse behavior (oven, short-circuit, overcharge, nail, crush) are developed. Finally, the models are used to determine that fluorinated binder plays a relatively unimportant role in thermal runaway.

  20. Research Advances: DNA Computing Targets West Nile Virus, Other Deadly Diseases, and Tic-Tac-Toe; Marijuana Component May Offer Hope for Alzheimer's Disease Treatment; New Wound Dressing May Lead to Maggot Therapy--Without the Maggots

    ERIC Educational Resources Information Center

    King, Angela G.

    2007-01-01

    This article presents three reports of research advances. The first report describes a deoxyribonucleic acid (DNA)-based computer that could lead to faster, more accurate tests for diagnosing West Nile Virus and bird flu. Representing the first "medium-scale integrated molecular circuit," it is the most powerful computing device of its type to…

  1. Turbine inter-disk cavity cooling air compressor

    DOEpatents

    Little, David Allen

    2001-01-01

    A combustion turbine may have a cooling circuit for directing a cooling medium through the combustion turbine to cool various components of the combustion turbine. This cooling circuit may include a compressor, a combustor shell and a component of the combustion turbine to be cooled. This component may be a rotating blade of the combustion turbine. A pressure changing mechanism is disposed in the combustion turbine between the component to be cooled and the combustor shell. The cooling medium preferably flows from the compressor to the combustor shell, through a cooler, the component to the cooled and the pressure changing mechanism. After flowing through the pressure changing mechanism, the cooling medium is returned to the combustor shell. The pressure changing mechanism preferably changes the pressure of the cooling medium from a pressure at which it is exhausted from the component to be cooled to approximately that of the combustor shell.

  2. Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors

    NASA Technical Reports Server (NTRS)

    Teverovsky, Alexander

    2007-01-01

    Solid tantalum capacitors are widely used in space applications to filter low-frequency ripple currents in power supply circuits and stabilize DC voltages in the system. Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. This is due to a short-circuit failure mode, which might be damaging to a power supply, and also to the capability of tantalum capacitors with manganese cathodes to self-ignite when a failure occurs in low-impedance applications. During such a failure, a substantial amount of energy is released by exothermic reaction of the tantalum pellet with oxygen generated by the overheated manganese oxide cathode, resulting not only in destruction of the part, but also in damage of the board and surrounding components. A specific feature of tantalum capacitors, compared to ceramic parts, is a relatively large value of capacitance, which in contemporary low-size chip capacitors reaches dozens and hundreds of microfarads. This might result in so-called surge current or turn-on failures in the parts when the board is first powered up. Such a failure, which is considered as the most prevalent type of failures in tantalum capacitors [I], is due to fast changes of the voltage in the circuit, dV/dt, producing high surge current spikes, I(sub sp) = Cx(dV/dt), when current in the circuit is unrestricted. These spikes can reach hundreds of amperes and cause catastrophic failures in the system. The mechanism of surge current failures has not been understood completely yet, and different hypotheses were discussed in relevant literature. These include a sustained scintillation breakdown model [1-3]; electrical oscillations in circuits with a relatively high inductance [4-6]; local overheating of the cathode [5,7, 8]; mechanical damage to tantalum pentoxide dielectric caused by the impact of MnO2 crystals [2,9, 10]; or stress-induced-generation of electron traps caused by electromagnetic forces developed during current spikes [11]. A commonly accepted explanation of the surge current failures is that at unlimited current supply during surge current conditions, the self-healing mechanism in tantalum capacitors does not work, and what would be a minor scintillation spike if the current were limited, becomes a catastrophic failure of the part [l, 12]. However, our data show that the scintillation breakdown voltages are significantly greater that the surge current breakdown voltages, so it is still not clear why the part, which has no scintillations, would fail at the same voltage during surge current testing (SCT).

  3. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2013-10-01 2013-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

  4. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2012-10-01 2012-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

  5. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2014-10-01 2014-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

  6. Gallium arsenide processing for gate array logic

    NASA Technical Reports Server (NTRS)

    Cole, Eric D.

    1989-01-01

    The development of a reliable and reproducible GaAs process was initiated for applications in gate array logic. Gallium Arsenide is an extremely important material for high speed electronic applications in both digital and analog circuits since its electron mobility is 3 to 5 times that of silicon, this allows for faster switching times for devices fabricated with it. Unfortunately GaAs is an extremely difficult material to process with respect to silicon and since it includes the arsenic component GaAs can be quite dangerous (toxic) especially during some heating steps. The first stage of the research was directed at developing a simple process to produce GaAs MESFETs. The MESFET (MEtal Semiconductor Field Effect Transistor) is the most useful, practical and simple active device which can be fabricated in GaAs. It utilizes an ohmic source and drain contact separated by a Schottky gate. The gate width is typically a few microns. Several process steps were required to produce a good working device including ion implantation, photolithography, thermal annealing, and metal deposition. A process was designed to reduce the total number of steps to a minimum so as to reduce possible errors. The first run produced no good devices. The problem occurred during an aluminum etch step while defining the gate contacts. It was found that the chemical etchant attacked the GaAs causing trenching and subsequent severing of the active gate region from the rest of the device. Thus all devices appeared as open circuits. This problem is being corrected and since it was the last step in the process correction should be successful. The second planned stage involves the circuit assembly of the discrete MESFETs into logic gates for test and analysis. Finally the third stage is to incorporate the designed process with the tested circuit in a layout that would produce the gate array as a GaAs integrated circuit.

  7. Anomalous neural circuit function in schizophrenia during a virtual Morris water task.

    PubMed

    Folley, Bradley S; Astur, Robert; Jagannathan, Kanchana; Calhoun, Vince D; Pearlson, Godfrey D

    2010-02-15

    Previous studies have reported learning and navigation impairments in schizophrenia patients during virtual reality allocentric learning tasks. The neural bases of these deficits have not been explored using functional MRI despite well-explored anatomic characterization of these paradigms in non-human animals. Our objective was to characterize the differential distributed neural circuits involved in virtual Morris water task performance using independent component analysis (ICA) in schizophrenia patients and controls. Additionally, we present behavioral data in order to derive relationships between brain function and performance, and we have included a general linear model-based analysis in order to exemplify the incremental and differential results afforded by ICA. Thirty-four individuals with schizophrenia and twenty-eight healthy controls underwent fMRI scanning during a block design virtual Morris water task using hidden and visible platform conditions. Independent components analysis was used to deconstruct neural contributions to hidden and visible platform conditions for patients and controls. We also examined performance variables, voxel-based morphometry and hippocampal subparcellation, and regional BOLD signal variation. Independent component analysis identified five neural circuits. Mesial temporal lobe regions, including the hippocampus, were consistently task-related across conditions and groups. Frontal, striatal, and parietal circuits were recruited preferentially during the visible condition for patients, while frontal and temporal lobe regions were more saliently recruited by controls during the hidden platform condition. Gray matter concentrations and BOLD signal in hippocampal subregions were associated with task performance in controls but not patients. Patients exhibited impaired performance on the hidden and visible conditions of the task, related to negative symptom severity. While controls showed coupling between neural circuits, regional neuroanatomy, and behavior, patients activated different task-related neural circuits, not associated with appropriate regional neuroanatomy. GLM analysis elucidated several comparable regions, with the exception of the hippocampus. Inefficient allocentric learning and memory in patients may be related to an inability to recruit appropriate task-dependent neural circuits. Copyright 2009 Elsevier Inc. All rights reserved.

  8. Solid state remote circuit selector switch

    NASA Technical Reports Server (NTRS)

    Peterson, V. S.

    1970-01-01

    Remote switching circuit utilizes voltage logic to switch on desired circuit. Circuit controls rotating multi-range pressure transducers in jet engine testing and can be used in coded remote circuit activator where sequence of switching has to occur in defined length of time to prevent false or undesired circuit activation.

  9. Retractable pin dual in-line package test clip

    DOEpatents

    Bandzuch, Gregory S.; Kosslow, William J.

    1996-01-01

    This invention is a Dual In-Line Package (DIP) test clip for use when troubleshooting circuits containing DIP integrated circuits. This test clip is a significant improvement over existing DIP test clips in that it has retractable pins which will permit troubleshooting without risk of accidentally shorting adjacent pins together when moving probes to different pins on energized circuits or when the probe is accidentally bumped while taking measurements.

  10. Aerosol-jet-printed, 1 volt H-bridge drive circuit on plastic with integrated electrochromic pixel.

    PubMed

    Ha, Mingjing; Zhang, Wei; Braga, Daniele; Renn, Michael J; Kim, Chris H; Frisbie, C Daniel

    2013-12-26

    In this report, we demonstrate a printed, flexible, and low-voltage circuit that successfully drives a polymer electrochromic (EC) pixel as large as 4 mm(2) that is printed on the same substrate. All of the key components of the drive circuitry, namely, resistors, capacitors, and transistors, were aerosol-jet-printed onto a plastic foil; metallic electrodes and interconnects were the only components prepatterned on the plastic by conventional photolithography. The large milliampere drive currents necessary to switch a 4 mm(2) EC pixel were controlled by printed electrolyte-gated transistors (EGTs) that incorporate printable ion gels for the gate insulator layers and poly(3-hexylthiophene) for the semiconductor channels. Upon application of a 1 V input pulse, the circuit switches the printed EC pixel ON (red) and OFF (blue) two times in approximately 4 s. The performance of the circuit and the behavior of the individual resistors, capacitors, EGTs, and the EC pixel are analyzed as functions of the printing parameters and operating conditions.

  11. Additive manufacturing of hybrid circuits

    DOE PAGES

    Bell, Nelson S.; Sarobol, Pylin; Cook, Adam; ...

    2016-03-26

    There is a rising interest in developing functional electronics using additively manufactured components. Considerations in materials selection and pathways to forming hybrid circuits and devices must demonstrate useful electronic function; must enable integration; and must complement the complex shape, low cost, high volume, and high functionality of structural but generally electronically passive additively manufactured components. This article reviews several emerging technologies being used in industry and research/development to provide integration advantages of fabricating multilayer hybrid circuits or devices. First, we review a maskless, noncontact, direct write (DW) technology that excels in the deposition of metallic colloid inks for electrical interconnects.more » Second, we review a complementary technology, aerosol deposition (AD), which excels in the deposition of metallic and ceramic powder as consolidated, thick conformal coatings and is additionally patternable through masking. As a result, we show examples of hybrid circuits/devices integrated beyond 2-D planes, using combinations of DW or AD processes and conventional, established processes.« less

  12. ac Modeling and impedance spectrum tests of the superconducting magnetic field coils for the Wendelstein 7-X fusion experiment.

    PubMed

    Ehmler, Hartmut; Köppen, Matthias

    2007-10-01

    The impedance spectrum test was employed for detection of short circuits within Wendelstein 7-X (W7-X) superconducting magnetic field coils. This test is based on measuring the complex impedance over several decades of frequency. The results are compared to predictions of appropriate electrical equivalent circuits of coils in different production states or during cold test. When the equivalent circuit is not too complicated the impedance can be represented by an analytic function. A more detailed analysis is performed with a network simulation code. The overall agreement of measured and calculated or simulated spectra is good. Two types of short circuits which appeared are presented and analyzed. The detection limit of the method is discussed. It is concluded that combined high-voltage ac and low-voltage impedance spectrum tests are ideal means to rule out short circuits in the W7-X coils.

  13. Note: Inter-satellite laser range-rate measurement by using digital phase locked loop.

    PubMed

    Liang, Yu-Rong; Duan, Hui-Zong; Xiao, Xin-Long; Wei, Bing-Bing; Yeh, Hsien-Chi

    2015-01-01

    This note presents an improved high-resolution frequency measurement system dedicated for the inter-satellite range-rate monitoring that could be used in the future's gravity recovery mission. We set up a simplified common signal test instead of the three frequencies test. The experimental results show that the dominant noises are the sampling time jitter and the thermal drift of electronic components, which can be reduced by using the pilot-tone correction and passive thermal control. The improved noise level is about 10(-8) Hz/Hz(1/2)@0.01Hz, limited by the signal-to-noise ratio of the sampling circuit.

  14. Note: Inter-satellite laser range-rate measurement by using digital phase locked loop

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Liang, Yu-Rong; Department of Electronics and Information Engineering, Huazhong University of Science and Technology, 1037 Luo Yu Road, Wuhan 430074; Duan, Hui-Zong

    2015-01-15

    This note presents an improved high-resolution frequency measurement system dedicated for the inter-satellite range-rate monitoring that could be used in the future’s gravity recovery mission. We set up a simplified common signal test instead of the three frequencies test. The experimental results show that the dominant noises are the sampling time jitter and the thermal drift of electronic components, which can be reduced by using the pilot-tone correction and passive thermal control. The improved noise level is about 10{sup −8} Hz/Hz{sup 1/2}@0.01Hz, limited by the signal-to-noise ratio of the sampling circuit.

  15. Note: Inter-satellite laser range-rate measurement by using digital phase locked loop

    NASA Astrophysics Data System (ADS)

    Liang, Yu-Rong; Duan, Hui-Zong; Xiao, Xin-Long; Wei, Bing-Bing; Yeh, Hsien-Chi

    2015-01-01

    This note presents an improved high-resolution frequency measurement system dedicated for the inter-satellite range-rate monitoring that could be used in the future's gravity recovery mission. We set up a simplified common signal test instead of the three frequencies test. The experimental results show that the dominant noises are the sampling time jitter and the thermal drift of electronic components, which can be reduced by using the pilot-tone correction and passive thermal control. The improved noise level is about 10-8 Hz/Hz1/2@0.01Hz, limited by the signal-to-noise ratio of the sampling circuit.

  16. Analytical modeling of circuit aerodynamics in the new NASA Lewis wind tunnel

    NASA Technical Reports Server (NTRS)

    Towne, C. E.; Povinelli, L. A.; Kunik, W. G.; Muramoto, K. K.; Hughes, C. E.; Levy, R.

    1985-01-01

    Rehabilitation and extention of the capability of the altitude wind tunnel (AWT) was analyzed. The analytical modeling program involves the use of advanced axisymmetric and three dimensional viscous analyses to compute the flow through the various AWT components. Results for the analytical modeling of the high speed leg aerodynamics are presented; these include: an evaluation of the flow quality at the entrance to the test section, an investigation of the effects of test section bleed for different model blockages, and an examination of three dimensional effects in the diffuser due to reentry flow and due to the change in cross sectional shape of the exhaust scoop.

  17. TRANSISTOR HIGH VOLTAGE POWER SUPPLY

    DOEpatents

    Driver, G.E.

    1958-07-15

    High voltage, direct current power supplies are described for use with battery powered nuclear detection equipment. The particular advantages of the power supply described, are increased efficiency and reduced size and welght brought about by the use of transistors in the circuit. An important feature resides tn the employment of a pair of transistors in an alternatefiring oscillator circuit having a coupling transformer and other circuit components which are used for interconnecting the various electrodes of the transistors.

  18. DESIGN OF CIRCUITS FOR THE PATTERN ARTICULATION UNIT. Report No. 127

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Smith, K.C.

    1962-08-31

    The Pattern Articulation Unit embodies a central core of 1024 identical processing modules called stalactites'' arranged in a two-dimensional array with only local connectivity. Two possible complete circuit realizations of the stalactite are described. Stalactites of either design contain about 50 transistors, 250 diodes, 250 resistors, and 50 capacitors. Stalactite organization, signal flow, the bubbling register connection, the requirements of a working register, design of stacking logic, mode of operation, circuit design, direct and conditional input, design of bubbling logic, complement circuits, output and circuit, up and down drivers, and cable diivers and terminators are described. Experimental verification of variousmore » components is discussed. (M.C.G.)« less

  19. Vehicle drive module having improved cooling configuration

    DOEpatents

    Radosevich, Lawrence D.; Meyer, Andreas A.; Kannenberg, Daniel G.; Kaishian, Steven C.; Beihoff, Bruce C.

    2007-02-13

    An electric vehicle drive includes a thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. Power electronic circuits are thermally matched, such as between component layers and between the circuits and the support. The support may form a shield from both external EMI/RFI and from interference generated by operation of the power electronic circuits. Features may be provided to permit and enhance connection of the circuitry to external circuitry, such as improved terminal configurations. Modular units may be assembled that may be coupled to electronic circuitry via plug-in arrangements or through interface with a backplane or similar mounting and interconnecting structures.

  20. Thermally matched fluid cooled power converter

    DOEpatents

    Radosevich, Lawrence D.; Kannenberg, Daniel G.; Kaishian, Steven C.; Beihoff, Bruce C.

    2005-06-21

    A thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. Power electronic circuits are thermally matched, such as between component layers and between the circuits and the support. The support may form a shield from both external EMI/RFI and from interference generated by operation of the power electronic circuits. Features may be provided to permit and enhance connection of the circuitry to external circuitry, such as improved terminal configurations. Modular units may be assembled that may be coupled to electronic circuitry via plug-in arrangements or through interface with a backplane or similar mounting and interconnecting structures.

  1. Testbed Experiment for SPIDER: A Photonic Integrated Circuit-based Interferometric imaging system

    NASA Astrophysics Data System (ADS)

    Badham, K.; Duncan, A.; Kendrick, R. L.; Wuchenich, D.; Ogden, C.; Chriqui, G.; Thurman, S. T.; Su, T.; Lai, W.; Chun, J.; Li, S.; Liu, G.; Yoo, S. J. B.

    The Lockheed Martin Advanced Technology Center (LM ATC) and the University of California at Davis (UC Davis) are developing an electro-optical (EO) imaging sensor called SPIDER (Segmented Planar Imaging Detector for Electro-optical Reconnaissance) that seeks to provide a 10x to 100x size, weight, and power (SWaP) reduction alternative to the traditional bulky optical telescope and focal-plane detector array. The substantial reductions in SWaP would reduce cost and/or provide higher resolution by enabling a larger-aperture imager in a constrained volume. Our SPIDER imager replaces the traditional optical telescope and digital focal plane detector array with a densely packed interferometer array based on emerging photonic integrated circuit (PIC) technologies that samples the object being imaged in the Fourier domain (i.e., spatial frequency domain), and then reconstructs an image. Our approach replaces the large optics and structures required by a conventional telescope with PICs that are accommodated by standard lithographic fabrication techniques (e.g., complementary metal-oxide-semiconductor (CMOS) fabrication). The standard EO payload integration and test process that involves precision alignment and test of optical components to form a diffraction limited telescope is, therefore, replaced by in-process integration and test as part of the PIC fabrication, which substantially reduces associated schedule and cost. In this paper we describe the photonic integrated circuit design and the testbed used to create the first images of extended scenes. We summarize the image reconstruction steps and present the final images. We also describe our next generation PIC design for a larger (16x area, 4x field of view) image.

  2. Leakage current-induced effects in the silicon microstrip and gas electron multiplier readout chain and their compensation method

    NASA Astrophysics Data System (ADS)

    Zubrzycka, W.; Kasinski, K.

    2018-04-01

    Leakage current flowing into the charge sensitive amplifier (CSA) is a common issue in many radiation detection systems as it can increase overall system noise, shift a DC baseline or even lead a recording channel to instability. The commonly known leakage current contributor is a detector, however other system components like wires or an input protection circuit may become a serious problem. Compensation of the leakage current resulting from the electrostatic discharge (ESD) protection circuit by properly sizing its components is possible only for a narrow temperature range. Moreover, the leakage current from external sources can be significantly larger. Many applications, especially High Energy Physics (HEP) experiments, require a fast baseline restoration for high input hit rates by applying either a low-value feedback resistor or a high feedback resistance combined with a pulsed reset circuit. Leakage current flowing in the feedback in conjunction with a large feedback resistance supplied with a pulsed reset results in a significant voltage offset between the CSA input and output which can cause problems (e.g. fake hits or instability). This paper shows an issue referred to the leakage current of the ESD protection circuit flowing into the input amplifier. The following analysis and proposed solution is a result of the time and energy readout ASIC project realization for the Compressed Baryonic Matter (CBM) experiment at FAIR (Facility for Antiproton and Ion Research) in Darmstadt, Germany. This chip is purposed to work with microstrip and gaseous detectors, with high average input pulses frequencies (250 kHit/s per channel) and the possibility to process input charge of both polarities. We present measurements of the test structure fabricated in UMC 180 nm technology and propose a solution addressing leakage current related issues. This work combines the leakage current compensation capabilities at the CSA level with high, controllable value of the amplifier feedback resistor independent of the leakage current level and polarity. The simulation results of the double, switchable, Krummenacher circuit-based feedback application in the CSA with a pulsed reset functionality are presented.

  3. Quasi-Linear Circuit

    NASA Technical Reports Server (NTRS)

    Bradley, William; Bird, Ross; Eldred, Dennis; Zook, Jon; Knowles, Gareth

    2013-01-01

    This work involved developing spacequalifiable switch mode DC/DC power supplies that improve performance with fewer components, and result in elimination of digital components and reduction in magnetics. This design is for missions where systems may be operating under extreme conditions, especially at elevated temperature levels from 200 to 300 degC. Prior art for radiation-tolerant DC/DC converters has been accomplished utilizing classical magnetic-based switch mode converter topologies; however, this requires specific shielding and component de-rating to meet the high-reliability specifications. It requires complex measurement and feedback components, and will not enable automatic re-optimization for larger changes in voltage supply or electrical loading condition. The innovation is a switch mode DC/DC power supply that eliminates the need for processors and most magnetics. It can provide a well-regulated voltage supply with a gain of 1:100 step-up to 8:1 step down, tolerating an up to 30% fluctuation of the voltage supply parameters. The circuit incorporates a ceramic core transformer in a manner that enables it to provide a well-regulated voltage output without use of any processor components or magnetic transformers. The circuit adjusts its internal parameters to re-optimize its performance for changes in supply voltage, environmental conditions, or electrical loading at the output

  4. Function does not follow form in gene regulatory circuits.

    PubMed

    Payne, Joshua L; Wagner, Andreas

    2015-08-20

    Gene regulatory circuits are to the cell what arithmetic logic units are to the chip: fundamental components of information processing that map an input onto an output. Gene regulatory circuits come in many different forms, distinct structural configurations that determine who regulates whom. Studies that have focused on the gene expression patterns (functions) of circuits with a given structure (form) have examined just a few structures or gene expression patterns. Here, we use a computational model to exhaustively characterize the gene expression patterns of nearly 17 million three-gene circuits in order to systematically explore the relationship between circuit form and function. Three main conclusions emerge. First, function does not follow form. A circuit of any one structure can have between twelve and nearly thirty thousand distinct gene expression patterns. Second, and conversely, form does not follow function. Most gene expression patterns can be realized by more than one circuit structure. And third, multifunctionality severely constrains circuit form. The number of circuit structures able to drive multiple gene expression patterns decreases rapidly with the number of these patterns. These results indicate that it is generally not possible to infer circuit function from circuit form, or vice versa.

  5. Estimating the Probability of Electrical Short Circuits from Tin Whiskers. Part 2

    NASA Technical Reports Server (NTRS)

    Courey, Karim J.; Asfour, Shihab S.; Onar, Arzu; Bayliss, Jon A.; Ludwig, Larry L.; Wright, Maria C.

    2009-01-01

    To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage.

  6. Design issues of a low cost lock-in amplifier readout circuit for an infrared detector

    NASA Astrophysics Data System (ADS)

    Scheepers, L.; Schoeman, J.

    2014-06-01

    In the past, high resolution thermal sensors required expensive cooling techniques making the early thermal imagers expensive to operate and cumbersome to transport, limiting them mainly to military applications. However, the introduction of uncooled microbolometers has overcome many of earlier problems and now shows great potential for commercial optoelectric applications. The structure of uncooled microbolometer sensors, especially their smaller size, makes them attractive in low cost commercial applications requiring high production numbers with relatively low performance requirements. However, the biasing requirements of these microbolometers cause these sensors to generate a substantial amount of noise on the output measurements due to self-heating. Different techniques to reduce this noise component have been attempted, such as pulsed biasing currents and the use of blind bolometers as common mode reference. These techniques proved to either limit the performance of the microbolometer or increase the cost of their implementation. The development of a low cost lock-in amplifier provides a readout technique to potentially overcome these challenges. High performance commercial lock-in amplifiers are very expensive. Using this as a readout circuit for a microbolometer will take away from the low manufacturing cost of the detector array. Thus, the purpose of this work was to develop a low cost readout circuit using the technique of phase sensitive detection and customizing this as a readout circuit for microbolometers. The hardware and software of the readout circuit was designed and tested for improvement of the signal-to-noise ratio (SNR) of the microbolometer signal. An optical modulation system was also developed in order to effectively identify the desired signal from the noise with the use of the readout circuit. A data acquisition and graphical user interface sub system was added in order to display the signal recovered by the readout circuit. The readout circuit was able to enhance the SNR of the microbolometer signal significantly. It was shown that the quality of the phase sensitive detector plays a significant role in the effectiveness of the readout circuit to improve the SNR.

  7. Electronic zero-point fluctuation forces inside circuit components

    PubMed Central

    Leonhardt, Ulf

    2018-01-01

    One of the most intriguing manifestations of quantum zero-point fluctuations are the van der Waals and Casimir forces, often associated with vacuum fluctuations of the electromagnetic field. We study generalized fluctuation potentials acting on internal degrees of freedom of components in electrical circuits. These electronic Casimir-like potentials are induced by the zero-point current fluctuations of any general conductive circuit. For realistic examples of an electromechanical capacitor and a superconducting qubit, our results reveal the possibility of tunable forces between the capacitor plates, or the level shifts of the qubit, respectively. Our analysis suggests an alternative route toward the exploration of Casimir-like fluctuation potentials, namely, by characterizing and measuring them as a function of parameters of the environment. These tunable potentials may be useful for future nanoelectromechanical and quantum technologies. PMID:29719863

  8. System and method for determining stator winding resistance in an AC motor

    DOEpatents

    Lu, Bin [Kenosha, WI; Habetler, Thomas G [Snellville, GA; Zhang, Pinjia [Atlanta, GA; Theisen, Peter J [West Bend, WI

    2011-05-31

    A system and method for determining stator winding resistance in an AC motor is disclosed. The system includes a circuit having an input connectable to an AC source and an output connectable to an input terminal of an AC motor. The circuit includes at least one contactor and at least one switch to control current flow and terminal voltages in the AC motor. The system also includes a controller connected to the circuit and configured to modify a switching time of the at least one switch to create a DC component in an output of the system corresponding to an input to the AC motor and determine a stator winding resistance of the AC motor based on the injected DC component of the voltage and current.

  9. Radiation Effects and Hardening Techniques for Spacecraft Microelectronics

    NASA Astrophysics Data System (ADS)

    Gambles, J. W.; Maki, G. K.

    2002-01-01

    The natural radiation from the Van Allen belts, solar flares, and cosmic rays found outside of the protection of the earth's atmosphere can produce deleterious effects on microelectronics used in space systems. Historically civil space agencies and the commercial satellite industry have been able to utilize components produced in special radiation hardened fabrication process foundries that were developed during the 1970s and 1980s under sponsorship of the Departments of Defense (DoD) and Energy (DoE). In the post--cold war world the DoD and DoE push to advance the rad--hard processes has waned. Today the available rad--hard components lag two-plus technology node generations behind state- of-the-art commercial technologies. As a result space craft designers face a large performance gap when trying to utilize available rad--hard components. Compounding the performance gap problems, rad--hard components are becoming increasingly harder to get. Faced with the economic pitfalls associated with low demand versus the ever increasing investment required for integrated circuit manufacturing equipment most sources of rad--hard parts have simply exited this market in recent years, leaving only two domestic US suppliers of digital rad--hard components. This paper summarizes the radiation induced mechanisms that can cause digital microelectronics to fail in space, techniques that can be applied to mitigate these failure mechanisms, and ground based testing used to validate radiation hardness/tolerance. The radiation hardening techniques can be broken down into two classes, Hardness By Process (HBP) and Hardness By Design (HBD). Fortunately many HBD techniques can be applied to commercial fabrication processes providing space craft designer with radiation tolerant Application Specific Integrated Circuits (ASICs) that can bridge the performance gap between the special HBP foundries and the commercial state-of-the-art performance.

  10. Accurate time delay technology in simulated test for high precision laser range finder

    NASA Astrophysics Data System (ADS)

    Chen, Zhibin; Xiao, Wenjian; Wang, Weiming; Xue, Mingxi

    2015-10-01

    With the continuous development of technology, the ranging accuracy of pulsed laser range finder (LRF) is higher and higher, so the maintenance demand of LRF is also rising. According to the dominant ideology of "time analog spatial distance" in simulated test for pulsed range finder, the key of distance simulation precision lies in the adjustable time delay. By analyzing and comparing the advantages and disadvantages of fiber and circuit delay, a method was proposed to improve the accuracy of the circuit delay without increasing the count frequency of the circuit. A high precision controllable delay circuit was designed by combining the internal delay circuit and external delay circuit which could compensate the delay error in real time. And then the circuit delay accuracy could be increased. The accuracy of the novel circuit delay methods proposed in this paper was actually measured by a high sampling rate oscilloscope actual measurement. The measurement result shows that the accuracy of the distance simulated by the circuit delay is increased from +/- 0.75m up to +/- 0.15m. The accuracy of the simulated distance is greatly improved in simulated test for high precision pulsed range finder.

  11. Lightning effects on the NASA F-8 digital-fly-by-wire airplane

    NASA Technical Reports Server (NTRS)

    Plumer, J. A.; Fisher, F. A.; Walko, L. C.

    1975-01-01

    The effects of lightning on a Digital Fly-By-Wire (DFBW)aircraft control system were investigated. The aircraft was a NASA operated F-8 fitted with a modified Apollo guidance computer. Current pulses similar in waveshape to natural lightning, but lower in amplitude, were injected into the aircraft. Measurements were made of the voltages induced on the DFBW circuits, the total current induced on the bundles of wires, the magnetic field intensity inside the aircraft, and the current density on the skin of the aircraft. Voltage measurements were made in both the line-to-ground and line-to-line modes. Voltages measured at the non-destructive test level were then scaled upward to determine how much would be produced by actual lightning. A 200,000 ampere severe lightning flash would produce between 40 and 2000 volts in DFBW circuits. Some system components are expected to be vulnerable to these voltages.

  12. Activity-dependent stochastic resonance in recurrent neuronal networks

    NASA Astrophysics Data System (ADS)

    Volman, Vladislav

    2009-03-01

    An important source of noise for neuronal networks is that of the stochastic nature of synaptic transmission. In particular, there can occur spontaneous asynchronous release of neurotransmitter at a rate that is strongly dependent on the presynaptic Ca2+ concentration and hence strongly dependent on the rate of spike induced Ca2+. Here it is shown that this noise can lead to a new form of stochastic resonance for local circuits consisting of roughly 100 neurons - a ``microcolumn''- coupled via noisy plastic synapses. Furthermore, due to the plastic coupling and activity-dependent noise component, the detection of weak stimuli will also depend on the structure of the latter. In addition, the circuit can exhibit short-term memory, by which we mean that spiking will continue to occur for a transient period following removal of the stimulus. These results can be directly tested in experiments on cultured networks.

  13. Cosmic Microwave Background Polarization Detector with High Efficiency, Broad Bandwidth, and Highly Symmetric Coupling to Transition Edge Sensor Bolometers

    NASA Technical Reports Server (NTRS)

    Wollack, E.; Cao, N.; Chuss, D.; Denis, K.; Hsieh, W.-T.; Moseley, S. Harvey; Schneider, G.; Stevenson, T.; Travers, D.; U-yen, K.

    2008-01-01

    Four probe antennas transfer signals from waveguide to microstrip lines. The probes not only provide broadband impedance matching, but also thermally isolate waveguide and detector. In addition, we developed a new photonic waveguide choke joint design, with four-fold symmetry, to suppress power leakage at the interface. We have developed facilities to test superconducting circuit elements using a cryogenic microwave probe station, and more complete systems in waveguide. We used the ring resonator shown below to measure a dielectric loss tangent < 7x10(exp -4) over 10 - 45 GHz. We have combined component simulations to predict the overall coupling from waveguide modes to bolometers. The result below shows the planar circuit and waveguide interface can utilize the high beam symmetry of HE11 circular feedhorns with > 99% coupling efficiency over 30% fractional bandwidth.

  14. A spatially localized architecture for fast and modular DNA computing

    NASA Astrophysics Data System (ADS)

    Chatterjee, Gourab; Dalchau, Neil; Muscat, Richard A.; Phillips, Andrew; Seelig, Georg

    2017-09-01

    Cells use spatial constraints to control and accelerate the flow of information in enzyme cascades and signalling networks. Synthetic silicon-based circuitry similarly relies on spatial constraints to process information. Here, we show that spatial organization can be a similarly powerful design principle for overcoming limitations of speed and modularity in engineered molecular circuits. We create logic gates and signal transmission lines by spatially arranging reactive DNA hairpins on a DNA origami. Signal propagation is demonstrated across transmission lines of different lengths and orientations and logic gates are modularly combined into circuits that establish the universality of our approach. Because reactions preferentially occur between neighbours, identical DNA hairpins can be reused across circuits. Co-localization of circuit elements decreases computation time from hours to minutes compared to circuits with diffusible components. Detailed computational models enable predictive circuit design. We anticipate our approach will motivate using spatial constraints for future molecular control circuit designs.

  15. Printed circuit board impedance matching step for microwave (millimeter wave) devices

    DOEpatents

    Pao, Hsueh-Yuan; Aguirre, Jerardo; Sargis, Paul

    2013-10-01

    An impedance matching ground plane step, in conjunction with a quarter wave transformer section, in a printed circuit board provides a broadband microwave matching transition from board connectors or other elements that require thin substrates to thick substrate (>quarter wavelength) broadband microwave (millimeter wave) devices. A method of constructing microwave and other high frequency electrical circuits on a substrate of uniform thickness, where the circuit is formed of a plurality of interconnected elements of different impedances that individually require substrates of different thicknesses, by providing a substrate of uniform thickness that is a composite or multilayered substrate; and forming a pattern of intermediate ground planes or impedance matching steps interconnected by vias located under various parts of the circuit where components of different impedances are located so that each part of the circuit has a ground plane substrate thickness that is optimum while the entire circuit is formed on a substrate of uniform thickness.

  16. MULTI-ELECTRODE TUBE PULSE MEMORY CIRCUIT

    DOEpatents

    Gundlach, J.C.; Reeves, J.B.

    1958-05-20

    Control circuits are described for pulse memory devices for scalers and the like, and more particularly to a driving or energizing circuit for a polycathode gaseous discharge tube having an elongated anode and a successive series of cathodes spaced opposite the anode along its length. The circuit is so arranged as to utilize an arc discharge between the anode and a cathode to count a series of pulses. Upon application of an input pulse the discharge is made to occur between the anode and the next successive cathode, and an output pulse is produced when a particular subsequent cathode is reached. The circuit means for transfering the discharge by altering the anode potential and potential of the cathodes and interconnecting the cathodes constitutes the novel aspects of the invention. A low response time and reduced number of circuit components are the practical advantages of the described circuit.

  17. Test and Evaluation of the Surveyor 3 Television Camera Returned from the Moon by Apollo 12. Volume 1

    NASA Technical Reports Server (NTRS)

    1970-01-01

    Results are presented of engineering tests of the Surveyor III television camera, which resided on the moon for 2 and 1/2 years before being brought back to earth by the Apollo XII astronauts. Electric circuits, electrical, mechanical, and optical components and subsystems, the vidicon tube, and a variety of internal materials and surface coatings were examined to determine the effects of lunar exposure. Anomalies and failures uncovered were analyzed. For the most part, the camera parts withstood the extreme environment exceedingly well except where degradation of obsolete parts or suspect components had been anticipated. No significant evidence of cold welding was observed, and the anomalies were largely attributable to causes other than lunar exposure. Very little evidence of micrometeoroid impact was noted. Discoloration of material surfaces -- one of the major effects noted--was found to be due to lunar dust contamination and radiation damage. The extensive test data contained in this report are supplemented by results of tests of other Surveyor parts retrieved by the Apollo XII astronauts, which are contained in a companion report.

  18. A transportable 50 kA dual mode lightning simulator

    NASA Technical Reports Server (NTRS)

    Salisbury, K.; Lloyd, S.; Chen, Y. G.

    1991-01-01

    A transportable lightning simulator was designed, built and tested, which is capable of delivering more than 50 kA to an 8 micro-H test object. The simulator was designed to be a versatile device in the lightning laboratory while meeting the requirements of MIL-STD-1757A for component E current waveforms. The system is capable of operating in either a ringing mode with a Q greater than 5 and a nominal frequency of 160 kHz, or a unipolar mode with no hardware configuration changes. The ringing mode is obtained by the LCR series circuit formed by the pulse generator and test object. The unipolar mode is obtained by closing an electrically triggered crowbar switch at peak current. The simulator exceeds the peak current requirement and rate of rise requirements for MIL-STD-1757A in both the ringing and unipolar modes. The pulse half width in the unipolar mode is in excess of 50 microsec and the action is in excess of 10(exp 5) A(exp 2)s. The design, component values, and test results are presented.

  19. General Aspects of Two-Component Regulatory Circuits in Bacteria: Domains, Signals and Roles.

    PubMed

    Padilla-Vaca, Felipe; Mondragón-Jaimes, Verónica; Franco, Bernardo

    2017-01-01

    All living organisms are subject to changing environments, which must be sensed in order to respond swiftly and efficiently. Two-component systems (TCS) are signal transduction regulatory circuits based typically on a membrane bound sensor kinase and a cytoplasmic response regulator, that is activated through a histidine to aspartate phosphorelay reactions. Activated response regulator acts usually as a transcription factor. The best known examples were identified in bacteria, but they are also found in fungi, algae and plants. Thus far, they are not found in mammals. Regulatory circuits coupled to two-component systems exhibit a myriad of responses to environmental stimuli such as: redox potential, pH, specific metabolites, pressure, light and more recently to specific antimicrobial peptides that activate a sensor kinase responsible for expressing virulence factors through the active response regulator. In this review we explore general aspects on two-component systems that ultimately can play a role on virulence regulation, also the intriguing domain properties of the sensor kinases that can be a potential target for antimicrobial compounds. Only a handful of sensor kinases are extensively characterized, the vast majority belong to what we call 'the dark matter of bacterial signal transduction' since no known signal, structure and biochemical properties are available. Regulatory circuits from vertebrate pathogenic organisms can explain virulence in terms of either response to environmental factors or specific niche occupancy. Hopefully, knowledge on these signal transduction systems can lead to identify novel molecules that target two-component systems, since the increase of drug resistant microorganisms is worrisome. Copyright© Bentham Science Publishers; For any queries, please email at epub@benthamscience.org.

  20. Process technology and effects of spallation products: Circuit components, maintenance, and handling

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Sigg, B.; Haines, S.J.; Dressler, R.

    1996-06-01

    Working Session D included an assessment of the status of the technology and components required to: (1) remove impurities from the liquid metal (mercury or Pb-Bi) target flow loop including the effects of spallation products, (2) provide the flow parameters necessary for target operations, and (3) maintain the target system. A series of brief presentations were made to focus the discussion on these issues. The subjects of these presentations, and presenters were: (1) Spallation products and solubilities - R. Dressler; (2) Spallation products for Pb-Bi - Y. Orlov; (3) Clean/up/impurity removal components - B. Sigg; (4) {open_quotes}Road-Map{close_quotes} and remote handlingmore » needs - T. McManamy; (5) Remote handling issues and development - M. Holding. The overall conclusion of this session was that, with the exception of (i) spallation product related processing issues, (ii) helium injection and clean-up, and (iii) specialized remote handling equipment, the technology for all other circuit components (excluding the target itself) exists. Operating systems at the Institute of Physics in Riga, Latvia (O. Lielausis) and at Ben-Gurion University in Beer Shiva, Israel (S. Lesin) have demonstrated that other liquid metal circuit components including pumps, heat exchangers, valves, seals, and piping are readily available and have been reliably used for many years. In the three areas listed above, the designs and analysis are not judged to be mature enough to determine whether and what types of technology development are required. Further design and analysis of the liquid metal target system is therefore needed to define flow circuit processing and remote handling equipment requirements and thereby identify any development needs.« less

  1. Development of simulated and ovine models of extracorporeal life support to improve understanding of circuit-host interactions.

    PubMed

    Shekar, Kiran; Fung, Yoke L; Diab, Sara; Mullany, Daniel V; McDonald, Charles I; Dunster, Kimble R; Fisquet, Stephanie; Platts, David G; Stewart, David; Wallis, Steven C; Smith, Maree T; Roberts, Jason A; Fraser, John F

    2012-06-01

    Extracorporeal life support (ECLS) is a lifesaving technology that is being increasingly used in patients with severe cardiorespiratory failure. However, ECLS is not without risks. The biosynthetic interface between the patient and the circuit can significantly alter inflammation, coagulation, pharmacokinetics and disposition of trace elements. The relative contributions of the pump, disease and patient in propagating these alterations are difficult to quantify in critically ill patients with multiple organ failure. To design a model where the relevance of individual components could be assessed, in isolation and in combination. Four ECLS models were developed and tested - an in-vitro simulated ECLS circuit; and ECLS in healthy sheep, sheep with acute lung injury (ALI), and sheep with ALI together with transfusion of old or new blood. Successful design of in-vitro and in-vivo models. We successfully conducted multiple experiments in the simulated circuits and ECLS runs in healthy and ALI sheep. We obtained preliminary data on inflammation, coagulation, histology, pharmacokinetics and trace element disposition during ECLS. The establishment of in-vitro and in-vivo models provides a powerful means for enhancing knowledge of the pathophysiology associated with ECLS and identification of key factors likely to influence patient outcomes. A clearer description of the contribution of disease and therapeutic interventions may allow improved design of equipment, membranes, medicines and physiological goals for improved patient care.

  2. Development and testing of bio-inspired microelectromechanical pressure sensor arrays for increased situational awareness for marine vehicles

    NASA Astrophysics Data System (ADS)

    Dusek, J.; Kottapalli, A. G. P.; Woo, M. E.; Asadnia, M.; Miao, J.; Lang, J. H.; Triantafyllou, M. S.

    2013-01-01

    The lateral line found on most species of fish is a sensory organ without analog in humans. Using sensory feedback from the lateral line, fish are able to track prey, school, avoid obstacles, and detect vortical flow structures. Composed of both a superficial component, and a component contained within canals beneath the fish’s skin, the lateral line acts in a similar fashion to an array of differential pressure sensors. In an effort to enhance the situational and environmental awareness of marine vehicles, lateral-line-inspired pressure sensor arrays were developed to mimic the enhanced sensory capabilities observed in fish. Three flexible and waterproof pressure sensor arrays were fabricated for use as a surface-mounted ‘smart skin’ on marine vehicles. Two of the sensor arrays were based around the use of commercially available piezoresistive sensor dies, with innovative packaging schemes to allow for flexibility and underwater operation. The sensor arrays employed liquid crystal polymer and flexible printed circuit board substrates with metallic circuits and silicone encapsulation. The third sensor array employed a novel nanocomposite material set that allowed for the fabrication of a completely flexible sensor array. All three sensors were surface mounted on the curved hull of an autonomous kayak vehicle, and tested in both pool and reservoir environments. Results demonstrated that all three sensors were operational while deployed on the autonomous vehicle, and provided an accurate means for monitoring the vehicle dynamics.

  3. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... connection of electric detonator series; and (4) Total blasting circuit resistance prior to connection to the... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 57.6407 Section 57.6407... SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Explosives Electric...

  4. 30 CFR 75.824 - Electrical protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

  5. 30 CFR 75.824 - Electrical protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

  6. 30 CFR 75.824 - Electrical protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

  7. 30 CFR 75.824 - Electrical protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

  8. 30 CFR 75.824 - Electrical protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

  9. Steam cycle of the FR2 (in German)

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Perinic, D.; Schmidt, T.

    1973-01-01

    Following a brief explanation of the requirement of the experimental circuit, the use of irradiation and the circuit are described in detail. The installed experimental equipment within the test circuit is described and the safety problems discussed. The operation of the test equipment is summarized. (GE)

  10. Method of forming crystalline silicon devices on glass

    DOEpatents

    McCarthy, Anthony M.

    1995-01-01

    A method for fabricating single-crystal silicon microelectronic components on a silicon substrate and transferring same to a glass substrate. This is achieved by utilizing conventional silicon processing techniques for fabricating components of electronic circuits and devices on bulk silicon, wherein a bulk silicon surface is prepared with epitaxial layers prior to the conventional processing. The silicon substrate is bonded to a glass substrate and the bulk silicon is removed leaving the components intact on the glass substrate surface. Subsequent standard processing completes the device and circuit manufacturing. This invention is useful in applications requiring a transparent or insulating substrate, particularly for display manufacturing. Other applications include sensors, actuators, optoelectronics, radiation hard electronics, and high temperature electronics.

  11. SEM analysis of ionizing radiation effects in linear integrated circuits. [Scanning Electron Microscope

    NASA Technical Reports Server (NTRS)

    Stanley, A. G.; Gauthier, M. K.

    1977-01-01

    A successful diagnostic technique was developed using a scanning electron microscope (SEM) as a precision tool to determine ionization effects in integrated circuits. Previous SEM methods radiated the entire semiconductor chip or major areas. The large area exposure methods do not reveal the exact components which are sensitive to radiation. To locate these sensitive components a new method was developed, which consisted in successively irradiating selected components on the device chip with equal doses of electrons /10 to the 6th rad (Si)/, while the whole device was subjected to representative bias conditions. A suitable device parameter was measured in situ after each successive irradiation with the beam off.

  12. High level radioactive waste vitrification process equipment component testing

    NASA Astrophysics Data System (ADS)

    Siemens, D. H.; Health, W. C.; Larson, D. E.; Craig, S. N.; Berger, D. N.; Goles, R. W.

    1985-04-01

    Remote operability and maintainability of vitrification equipment were assessment under shielded cell conditions. The equipment tested will be applied to immobilize high level and transuranic liquid waste slurries that resulted from plutonium production for defense weapons. Equipment tested included: a turntable for handling waste canisters under the melter; a removable discharge cone in the melter overflow section; a thermocouple jumper that extends into a shielded cell; remote instrument and electrical connectors; remote, mechanical, and heat transfer aspects of the melter glass overflow section; a reamer to clean out plugged nozzles in the melter top; a closed circuit camera to view the melter interior; and a device to retrieve samples of the glass product. A test was also conduucted to evaluate liquid metals for use in a liquid metal sealing system.

  13. The LSLE echocardiograph - Commercial hardware aboard Spacelab. [Life Sciences Laboratory Equipment

    NASA Technical Reports Server (NTRS)

    Schwarz, R.

    1983-01-01

    The Life Sciences Laboratory Equipment Echocardiograph, a commercial 77020AC Ultrasound Imaging System modified to meet NASA's spacecraft standards, is described. The assembly consists of four models: display and control, scanner, scan converter, and physioamplifiers. Four separate processors communicate over an IEE-488 bus, and the system has more than 6000 individual components on 35 printed circuit cards. Three levels of self test are provided: a short test during power up, a basic test initiated by a front panel switch, and interactive tests for specific routines. Default mode operation further enhances reliability. Modifications of the original system include the replacement of ac power supplies with dc to dc converters, a slide-out keyboard (to prevent accidental operation), Teflon insulated wire, and additional shielding for the ultrasound transducer cable.

  14. Future opportunities for advancing glucose test device electronics.

    PubMed

    Young, Brian R; Young, Teresa L; Joyce, Margaret K; Kennedy, Spencer I; Atashbar, Massood Z

    2011-09-01

    Advancements in the field of printed electronics can be applied to the field of diabetes testing. A brief history and some new developments in printed electronics components applicable to personal test devices, including circuitry, batteries, transmission devices, displays, and sensors, are presented. Low-cost, thin, and lightweight materials containing printed circuits with energy storage or harvest capability and reactive/display centers, made using new printing/imaging technologies, are ideal for incorporation into personal-use medical devices such as glucose test meters. Semicontinuous rotogravure printing, which utilizes flexible substrates and polymeric, metallic, and/or nano "ink" composite materials to effect rapidly produced, lower-cost printed electronics, is showing promise. Continuing research advancing substrate, "ink," and continuous processing development presents the opportunity for research collaboration with medical device designers. © 2011 Diabetes Technology Society.

  15. Humidity Control in the U.S. Air Force Aircraft Service Shelter

    DTIC Science & Technology

    1988-06-30

    printed circuit board control module , terminal boards, and blowt.r, etc.) are off-the-shelf commercial components. Only the humidifier ho:;Ift, I...indication of the shelter RH. - Circuit Breaker: A 20 amp, three pole breaker is providud fur equipment protection. o Water Storage Tank. A stainless...tapped into the shelter’s existing electrical system at the panelboard, on the load side of the 100 Amp main AC circuit breaker. Power is then

  16. Efficiently characterizing the total error in quantum circuits

    NASA Astrophysics Data System (ADS)

    Carignan-Dugas, Arnaud; Wallman, Joel J.; Emerson, Joseph

    A promising technological advancement meant to enlarge our computational means is the quantum computer. Such a device would harvest the quantum complexity of the physical world in order to unfold concrete mathematical problems more efficiently. However, the errors emerging from the implementation of quantum operations are likewise quantum, and hence share a similar level of intricacy. Fortunately, randomized benchmarking protocols provide an efficient way to characterize the operational noise within quantum devices. The resulting figures of merit, like the fidelity and the unitarity, are typically attached to a set of circuit components. While important, this doesn't fulfill the main goal: determining if the error rate of the total circuit is small enough in order to trust its outcome. In this work, we fill the gap by providing an optimal bound on the total fidelity of a circuit in terms of component-wise figures of merit. Our bound smoothly interpolates between the classical regime, in which the error rate grows linearly in the circuit's length, and the quantum regime, which can naturally allow quadratic growth. Conversely, our analysis substantially improves the bounds on single circuit element fidelities obtained through techniques such as interleaved randomized benchmarking. This research was supported by the U.S. Army Research Office through Grant W911NF- 14-1-0103, CIFAR, the Government of Ontario, and the Government of Canada through NSERC and Industry Canada.

  17. Effects of hydraulic resistance circuit training on physical fitness components of potential relevance to +Gz tolerance.

    PubMed

    Jacobs, I; Bell, D G; Pope, J; Lee, W

    1987-08-01

    Recent studies carried out in the United States and Sweden have demonstrated that strength training can improve +Gz acceleration tolerance. Based on these findings, the Canadian Forces have introduced a training program for aircrew of high performance aircraft. This report describes the changes in physical fitness components considered relevant to +Gz tolerance after 12 weeks of training with this program. Prior to beginning training, 45 military personnel were tested, but only 20 completed a minimum of 24 training sessions. The following variables were measured in these 20 subjects before and after training: maximal strength of several large muscle groups during isokinetic contractions, maximal aerobic power and an endurance fitness index, maximal anaerobic power, anthropometric characteristics, and maximal expiratory pressure generated during exhalation. Training involved hydraulic resistance circuit training 2-4 times/week. The circuit consisted of 3 consecutive sets at each of 8 stations using Hydra-Gym equipment. The exercise:rest ratio was 20:40 s for the initial 4 training weeks and was then changed to 30:50. After training the changes in anthropometric measurements suggested that lean body mass was increased. Small, but significant, increases were also measured in muscle strength during bench press, biceps curls, squats, knee extension, and knee flexion. Neither maximal anaerobic power (i.e. muscular endurance) nor maximal expiratory pressure were changed after the training. Indices of endurance fitness were also increased in the present study. The relatively small increases in strength are probably due to the design of the exercise:rest ratio which resulted in improved strength and aerobic fitness.(ABSTRACT TRUNCATED AT 250 WORDS)

  18. High stability amplifier

    NASA Technical Reports Server (NTRS)

    Adams, W. A.; Reinhardt, V. S. (Inventor)

    1983-01-01

    An electrical RF signal amplifier for providing high temperature stability and RF isolation and comprised of an integrated circuit voltage regulator, a single transistor, and an integrated circuit operational amplifier mounted on a circuit board such that passive circuit elements are located on side of the circuit board while the active circuit elements are located on the other side is described. The active circuit elements are embedded in a common heat sink so that a common temperature reference is provided for changes in ambient temperature. The single transistor and operational amplifier are connected together to form a feedback amplifier powered from the voltage regulator with transistor implementing primarily the desired signal gain while the operational amplifier implements signal isolation. Further RF isolation is provided by the voltage regulator which inhibits cross-talk from other like amplifiers powered from a common power supply. Input and output terminals consisting of coaxial connectors are located on the sides of a housing in which all the circuit components and heat sink are located.

  19. A photonic circuit for complementary frequency shifting, in-phase quadrature/single sideband modulation and frequency multiplication: analysis and integration feasibility

    NASA Astrophysics Data System (ADS)

    Hasan, Mehedi; Hu, Jianqi; Nikkhah, Hamdam; Hall, Trevor

    2017-08-01

    A novel photonic integrated circuit architecture for implementing orthogonal frequency division multiplexing by means of photonic generation of phase-correlated sub-carriers is proposed. The circuit can also be used for implementing complex modulation, frequency up-conversion of the electrical signal to the optical domain and frequency multiplication. The principles of operation of the circuit are expounded using transmission matrices and the predictions of the analysis are verified by computer simulation using an industry-standard software tool. Non-ideal scenarios that may affect the correct function of the circuit are taken into consideration and quantified. The discussion of integration feasibility is illustrated by a photonic integrated circuit that has been fabricated using 'library' components and which features most of the elements of the proposed circuit architecture. The circuit is found to be practical and may be fabricated in any material platform that offers a linear electro-optic modulator such as organic or ferroelectric thin films hybridized with silicon photonics.

  20. All-semiconductor metamaterial-based optical circuit board at the microscale

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Min, Li; Huang, Lirong, E-mail: lrhuang@hust.edu.cn

    2015-07-07

    The newly introduced metamaterial-based optical circuit, an analogue of electronic circuit, is becoming a forefront topic in the fields of electronics, optics, plasmonics, and metamaterials. However, metals, as the commonly used plasmonic elements in an optical circuit, suffer from large losses at the visible and infrared wavelengths. We propose here a low-loss, all-semiconductor metamaterial-based optical circuit board at the microscale by using interleaved intrinsic GaAs and doped GaAs, and present the detailed design process for various lumped optical circuit elements, including lumped optical inductors, optical capacitors, optical conductors, and optical insulators. By properly combining these optical circuit elements and arrangingmore » anisotropic optical connectors, we obtain a subwavelength optical filter, which can always hold band-stop filtering function for various polarization states of the incident electromagnetic wave. All-semiconductor optical circuits may provide a new opportunity in developing low-power and ultrafast components and devices for optical information processing.« less

Top