Science.gov

Sample records for circuit test generation

  1. A hierarchical approach to test generation for CMOS VLSI circuits

    NASA Astrophysics Data System (ADS)

    Weening, Edward Christiaan

    A hierarchical approach to the automatic test pattern generation for large digital VLSI circuits, fabricated in CMOS technology, is developed and implemented. The use of information on the circuit's hierarchy, which is readily available from most modern CAD (Computer Aided Design) systems, speeds up the test generation process considerably and enhances the quality of the tests generated. The hierarchical test generation tool can also be integrated in future CAD systems making test generation and testability enhancement during circuit design feasible. The hierarchical approach is described at the switch, functional, and behavioral level. A test pattern generation algorithm at the switch level is presented. Test generation and fault simulation algorithms both using OBDD (Ordered Binary Decision Diagram) functional descriptions of the circuit modules are presented. A test plan generation method at the behavioral level is presented. Practical results show that the hierarchical approach to test generation is more efficient than a conventional, non-hierarchical approach, especially for switch level faults. The results also show that the use of Design For Testability (DFT) circuitry is supported at the behavioral level.

  2. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, Jr., Edward I.; Peterson, Kenneth A.; Barton, Daniel L.

    1998-01-01

    An electron beam apparatus and method for testing a circuit. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 .mu.m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits.

  3. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, E.I. Jr.; Peterson, K.A.; Barton, D.L.

    1998-07-14

    An electron beam apparatus and method for testing a circuit are disclosed. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 {micro}m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits. 7 figs.

  4. Test generation and fault detection for VLSI PPL circuits

    SciTech Connect

    Amin, A.A.M.

    1987-01-01

    The problem of design for testability of PPL logic circuits is addressed. A test-generation package was developed which utilizes the special features of PPL logic to generate high fault coverage test vectors at a reduced computational cost. The test strategy assumes that one of the scan design techniques is used. A new methodology for test-vectors compaction without compromising the fault coverage is also proposed. A fault-oriented test-generation algorithm combined with a heuristic test-generation algorithm are the essential ingredients of this package. The fault-oriented algorithm uses a modified D-algorithm which includes look-ahead features and a new seven-valued logic to improve the average speed of the test-generation process. Fault coverages in the 90% range were obtained using the test sequences generated by this package.

  5. Functional test generation for digital circuits described with a declarative language: LUSTRE

    NASA Astrophysics Data System (ADS)

    Almahrous, Mazen

    1990-08-01

    A functional approach to the test generation problem starting from a high level description is proposed. The circuit tested is modeled, using the LUSTRE high level data flow description language. The different LUSTRE primitives are translated to a SATAN format graph in order to evaluate the testability of the circuit and to generate test sequences. Another method of testing the complex circuits comprising an operative part and a control part is defined. It consists of checking experiments for the control part observed through the operative part. It was applied to the automata generated from a LUSTRE description of the circuit.

  6. Integrated circuit test-port architecture and method and apparatus of test-port generation

    DOEpatents

    Teifel, John

    2016-04-12

    A method and apparatus are provided for generating RTL code for a test-port interface of an integrated circuit. In an embodiment, a test-port table is provided as input data. A computer automatically parses the test-port table into data structures and analyzes it to determine input, output, local, and output-enable port names. The computer generates address-detect and test-enable logic constructed from combinational functions. The computer generates one-hot multiplexer logic for at least some of the output ports. The one-hot multiplexer logic for each port is generated so as to enable the port to toggle between data signals and test signals. The computer then completes the generation of the RTL code.

  7. Photoconductive circuit element pulse generator

    DOEpatents

    Rauscher, Christen

    1989-01-01

    A pulse generator for characterizing semiconductor devices at millimeter wavelength frequencies where a photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test.

  8. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1990-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  9. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1988-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  10. Chain Of Test Contacts For Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Lieneweg, Udo

    1989-01-01

    Test structure forms chain of "cross" contacts fabricated together with large-scale integrated circuits. If necessary, number of such chains incorporated at suitable locations in integrated-circuit wafer for determination of fabrication yield of contacts. In new structure, resistances of individual contacts determined: In addition to making it possible to identify local defects, enables generation of statistical distributions of contact resistances for prediction of "parametric" contact yield of fabrication process.

  11. Integrated-Circuit Pseudorandom-Number Generator

    NASA Technical Reports Server (NTRS)

    Steelman, James E.; Beasley, Jeff; Aragon, Michael; Ramirez, Francisco; Summers, Kenneth L.; Knoebel, Arthur

    1992-01-01

    Integrated circuit produces 8-bit pseudorandom numbers from specified probability distribution, at rate of 10 MHz. Use of Boolean logic, circuit implements pseudorandom-number-generating algorithm. Circuit includes eight 12-bit pseudorandom-number generators, outputs are uniformly distributed. 8-bit pseudorandom numbers satisfying specified nonuniform probability distribution are generated by processing uniformly distributed outputs of eight 12-bit pseudorandom-number generators through "pipeline" of D flip-flops, comparators, and memories implementing conditional probabilities on zeros and ones.

  12. Generating neural circuits that implement probabilistic reasoning.

    PubMed

    Barber, M J; Clark, J W; Anderson, C H

    2003-10-01

    We extend the hypothesis that neuronal populations represent and process analog variables in terms of probability density functions (PDFs). Aided by an intermediate representation of the probability density based on orthogonal functions spanning an underlying low-dimensional function space, it is shown how neural circuits may be generated from Bayesian belief networks. The ideas and the formalism of this PDF approach are illustrated and tested with several elementary examples, and in particular through a problem in which model-driven top-down information flow influences the processing of bottom-up sensory input. PMID:14682978

  13. Automatic Parametric Testing Of Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Jennings, Glenn A.; Pina, Cesar A.

    1989-01-01

    Computer program for parametric testing saves time and effort in research and development of integrated circuits. Software system automatically assembles various types of test structures and lays them out on silicon chip, generates sequency of test instructions, and interprets test data. Employs self-programming software; needs minimum of human intervention. Adapted to needs of different laboratories and readily accommodates new test structures. Program codes designed to be adaptable to most computers and test equipment now in use. Written in high-level languages to enhance transportability.

  14. Nanoelectronic circuit design and test

    NASA Astrophysics Data System (ADS)

    Simsir, Muzaffer Orkun

    Controlling power consumption in CMOS integrated circuits (ICs) during normal mode of operation is becoming one of the limiting factors to further scaling. In addition, it is a well known fact that during testing of a complex IC, power consumption can far exceed the values reached during its normal operation. High power consumption, combined with limited cooling support, leads to overheating of ICs. This can cause permanent damage to the chip or can invalidate test results due to the fact that extreme temperature variations lead to changes in path delays. Therefore, even good chips can fail the test. For these reasons, thermal problems during test need to be identified to prevent the loss of yield in CMOS ICs. In this thesis, we propose a methodology for thermally characterizing circuits under test. Using this methodology, it is possible to simulate the thermal profiles of the chips during test and prevent possible yield loss because of thermal problems. In addition to the problems associated with power and temperature, a more important barrier is the scaling limitations of the CMOS technology. It has been predicted that in next decade, it will not be possible to scale it further. In the near future, rather than a transition to a completely new technology, extensions to CMOS seem to be more realistic. Double-gate CMOS technology is one of the most promising alternatives that offers a simple extension to CMOS. The transistors of this technology are formed by adding a second gate across the conventional CMOS transistor gate. Designing circuits using this technology has attracted a lot of attention. However, as circuit design methods mature, there is a need to identify how these circuits can be tested. From a circuit testing viewpoint, it is unclear if CMOS fault models are comprehensive enough to model all defects in double-gate CMOS circuits. Therefore, fault models of this technology need to be defined to enable manufacturing-time testing. In this thesis, we

  15. Submicrosecond Power-Switching Test Circuit

    NASA Technical Reports Server (NTRS)

    Folk, Eric N.

    2006-01-01

    A circuit that changes an electrical load in a switching time shorter than 0.3 microsecond has been devised. This circuit can be used in testing the regulation characteristics of power-supply circuits . especially switching power-converter circuits that are supposed to be able to provide acceptably high degrees of regulation in response to rapid load transients. The combination of this power-switching circuit and a known passive constant load could be an attractive alternative to a typical commercially available load-bank circuit that can be made to operate in nominal constant-voltage, constant-current, and constant-resistance modes. The switching provided by a typical commercial load-bank circuit in the constant-resistance mode is not fast enough for testing of regulation in response to load transients. Moreover, some test engineers do not trust the test results obtained when using commercial load-bank circuits because the dynamic responses of those circuits are, variously, partly unknown and/or excessively complex. In contrast, the combination of this circuit and a passive constant load offers both rapid switching and known (or at least better known) load dynamics. The power-switching circuit (see figure) includes a signal-input section, a wide-hysteresis Schmitt trigger that prevents false triggering in the event of switch-contact bounce, a dual-bipolar-transistor power stage that drives the gate of a metal oxide semiconductor field-effect transistor (MOSFET), and the MOSFET, which is the output device that performs the switching of the load. The MOSFET in the specific version of the circuit shown in the figure is rated to stand off a potential of 100 V in the "off" state and to pass a current of 20 A in the "on" state. The switching time of this circuit (the characteristic time of rise or fall of the potential at the drain of the MOSFET) is .300 ns. The circuit can accept any of three control inputs . which one depending on the test that one seeks to perform: a

  16. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  17. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  18. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  19. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  20. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  1. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  2. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  3. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  4. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  5. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  6. BLOCKING OSCILLATOR DOUBLE PULSE GENERATOR CIRCUIT

    DOEpatents

    Haase, J.A.

    1961-01-24

    A double-pulse generator, particuiarly a double-pulse generator comprising a blocking oscillator utilizing a feedback circuit to provide means for producing a second pulse within the recovery time of the blocking oscillator, is described. The invention utilized a passive network which permits adjustment of the spacing between the original pulses derived from the blocking oscillator and further utilizes the original pulses to trigger a circuit from which other pulses are initiated. These other pulses are delayed and then applied to the input of the blocking oscillator, with the result that the output from the oscillator circuit contains twice the number of pulses originally initiated by the blocking oscillator itself.

  7. Conductive surge testing of circuits and systems

    NASA Technical Reports Server (NTRS)

    Richman, P.

    1980-01-01

    Techniques are given for conductive surge testing of powered electronic equipment. The correct definitions of common and normal mode are presented. Testing requires not only spike-surge generators with a suitable range of open-circuit voltage and short-circuit current waveshapes, but also appropriate means, termed couplers, for connecting test surges to the equipment under test. Key among coupler design considerations is minimization of fail positives resulting from reduction in delivered surge energy due to the coupler. Back-filters and the lines on which they are necessary, are considered as well as ground-fault and ground potential rise. A method for monitoring delivered and resulting surge waves is mentioned.

  8. A power semiconductor test circuit with reduced power requirements

    NASA Technical Reports Server (NTRS)

    Been, J. F.

    1970-01-01

    Switching circuit utilizing silicon controlled rectifier reduces input power requirements normally associated with testing power semiconductors in an operational type mode. Circuit alleviates problems of inaccessibility, lack of large amounts of power, physical size of power resistors, wiring, and heat generation.

  9. Memristive Sisyphus circuit for clock signal generation.

    PubMed

    Pershin, Yuriy V; Shevchenko, Sergey N; Nori, Franco

    2016-05-20

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as "dripping ants" or drops from leaky faucets.

  10. Memristive Sisyphus circuit for clock signal generation

    PubMed Central

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-01-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets. PMID:27199243

  11. Memristive Sisyphus circuit for clock signal generation

    NASA Astrophysics Data System (ADS)

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-05-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets.

  12. Periodic binary sequence generators: VLSI circuits considerations

    NASA Technical Reports Server (NTRS)

    Perlman, M.

    1984-01-01

    Feedback shift registers are efficient periodic binary sequence generators. Polynomials of degree r over a Galois field characteristic 2(GF(2)) characterize the behavior of shift registers with linear logic feedback. The algorithmic determination of the trinomial of lowest degree, when it exists, that contains a given irreducible polynomial over GF(2) as a factor is presented. This corresponds to embedding the behavior of an r-stage shift register with linear logic feedback into that of an n-stage shift register with a single two-input modulo 2 summer (i.e., Exclusive-OR gate) in its feedback. This leads to Very Large Scale Integrated (VLSI) circuit architecture of maximal regularity (i.e., identical cells) with intercell communications serialized to a maximal degree.

  13. Lithium Circuit Test Section Design and Fabrication

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas; Garber, Anne

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper will discuss the overall system design and build and the component testing findings.

  14. Lithium Circuit Test Section Design and Fabrication

    NASA Astrophysics Data System (ADS)

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  15. Flip-flop resolving time test circuit

    NASA Technical Reports Server (NTRS)

    Rosenberger, F.; Chaney, T. J.

    1982-01-01

    Integrated circuit (IC) flip-flop resolving time parameters are measured by wafer probing, without need of dicing or bonding, throught the incorporation of test structures on an IC together with the flip-flop to be measured. Several delays that are fabricated as part of the test circuit, including a voltage-controlled delay with a resolution of a few picosecs, are calibrated as part of the test procedure by integrating them into, and out of, the delay path of a ring oscillator. Each of the delay values is calculated by subtracting the period of the ring oscillator with the delay omitted from the period with the delay included. The delay measurement technique is sufficiently general for other applications. The technique is illustrated for the case of the flip-flop parameters of a 5-micron feature size NMOS circuit.

  16. Lithium Circuit Test Section Design and Fabrication

    SciTech Connect

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-20

    The Early Flight Fission -- Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  17. Test Structures For Bumpy Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.; Sayah, Hoshyar R.

    1989-01-01

    Cross-bridge resistors added to comb and serpentine patterns. Improved combination of test structures built into integrated circuit used to evaluate design rules, fabrication processes, and quality of interconnections. Consist of meshing serpentines and combs, and cross bridge. Structures used to make electrical measurements revealing defects in design or fabrication. Combination of test structures includes three comb arrays, two serpentine arrays, and cross bridge. Made of aluminum or polycrystalline silicon, depending on material in integrated-circuit layers evaluated. Aluminum combs and serpentine arrays deposited over steps made by polycrystalline silicon and diffusion layers, while polycrystalline silicon versions of these structures used to cross over steps made by thick oxide layer.

  18. Automatic generation of signal processing integrated circuits

    SciTech Connect

    Pope, S.P.

    1985-01-01

    A system for the automated design of signal processing integrated circuits is described in this thesis. The system is based on a library of circuit cells, and a software package that can configure the cells into complete integrated circuits. The architecture of the cell library is optimized for low and medium bandwidth digital signal processing applications. Circuits designed with the system use a multiprocessor architecture. Input to the system is a design file written in a specialized programming language. Software emulation from the design file is used to verify performance. A two-pass silicon compiler is used to translate the design file into a mask-level description of an integrated circuit. A major goal of the project is to make the system useable by those with little or no formal training in integrated circuits. A second goal is to reduce the time and cost associated with performing an integrated circuit design, while still producing designs which are reasonably efficient in their use of the technology. Development of the system was guided by basic research on appropriate architectures and circuit constructs for signal processors. As part of this research an integrated circuit was designed which performs speech analysis and synthesis. This vocoder circuit is intended for use in low-bit-rate digital speech transmission systems.

  19. Testing of the anemometer circuit: Data report

    NASA Technical Reports Server (NTRS)

    Moen, Michael J.

    1992-01-01

    The following text discusses results from the electronic step testing and the beginning of velocity step testing in the shock tube. It should be kept in mind that frequency response is always measured as the time from the beginning of the event to the minimum (positive inflection) of the 'bucket' that immediately follows the response. This report is not a complete account of the results from square wave testing. Some data is still in the process of being analyzed and efforts are being made to fit the data to both Freymuth's third order theory and modelled responses from SPICE circuit simulation software.

  20. Entangled Coherent States Generation in two Superconducting LC Circuits

    SciTech Connect

    Chen Meiyu; Zhang Weimin

    2008-11-07

    We proposed a novel pure electronic (solid state) device consisting of two superconducting LC circuits coupled to a superconducting flux qubit. The entangled coherent states of the two LC modes is generated through the measurement of the flux qubit states. The interaction of the flux qubit and two LC circuits is controlled by the external microwave control lines. The geometrical structure of the LC circuits is adjustable and makes a strong coupling between them achievable. This entangled coherent state generator can be realized by using the conventional microelectronic fabrication techniques which increases the feasibility of the experiment.

  1. Creative Test Generators

    ERIC Educational Resources Information Center

    Vickers, F. D.

    1973-01-01

    A brief description of a test generating program which generates questions concerning the Fortran programming language in a random but guided fashion and without resorting to an item bank.'' (Author/AK)

  2. Fastrac Gas Generator Testing

    NASA Technical Reports Server (NTRS)

    Nesman, Tomas E.; Dennis, Jay

    2001-01-01

    A rocket engine gas generator component development test was recently conducted at the Marshall Space Flight Center. This gas generator is intended to power a rocket engine turbopump by the combustion of Lox and RP-1. The testing demonstrated design requirements for start sequence, wall compatibility, performance, and stable combustion. During testing the gas generator injector was modified to improve distribution of outer wall coolant and the igniter boss was modified to investigate the use of a pyrotechnic igniter. Expected chamber pressure oscillations at longitudinal acoustic mode were measured for three different chamber lengths tested. High amplitude discrete oscillations resulted in the chamber-alone configurations when chamber acoustic modes coupled with feed-system acoustics modes. For the full gas generator configuration, which included a turbine inlet manifold, high amplitude oscillations occurred only at off-design very low power levels. This testing led to a successful gas generator design for the Fastrac 60,000 lb thrust engine.

  3. Fastrac Gas Generator Testing

    NASA Technical Reports Server (NTRS)

    Nesman, Tomas E.; Dennis, Jay

    1999-01-01

    A rocket engine gas generator component development test was recently conducted at the Marshall Space Flight Center. This gas generator was intended to power a rocket engine turbopump by the combustion of Lox and RP-1. The testing demonstrated design requirements for start sequence, wall compatibility, performance, and stable combustion. During testing the gas generator injector was modified to improve distribution of outer wall coolant and the igniter boss was modified to investigate the use of a pyrotechnic igniter, Expected chamber pressure oscillations at longitudinal acoustic modes were measured for three different chamber lengths tested. High amplitude discrete oscillations occurred in the chamber-alone configurations when chamber acoustic modes coupled with feed-system acoustics modes. For the full gas generator configuration, which included the turbine inlet manifold simulator, high amplitude oscillations occurred only at off-design very low power levels. This testing led to a successful gas generator design for the Fastrac 60,000 lb thrust engine.

  4. Reduced circuit implementation of encoder and syndrome generator

    DOEpatents

    Trager, Barry M; Winograd, Shmuel

    2014-05-27

    An error correction method and system includes an Encoder and Syndrome-generator that operate in parallel to reduce the amount of circuitry used to compute check symbols and syndromes for error correcting codes. The system and method computes the contributions to the syndromes and check symbols 1 bit at a time instead of 1 symbol at a time. As a result, the even syndromes can be computed as powers of the odd syndromes. Further, the system assigns symbol addresses so that there are, for an example GF(2.sup.8) which has 72 symbols, three (3) blocks of addresses which differ by a cube root of unity to allow the data symbols to be combined for reducing size and complexity of odd syndrome circuits. Further, the implementation circuit for generating check symbols is derived from syndrome circuit using the inverse of the part of the syndrome matrix for check locations.

  5. Calorimeter Preamplifier Hybrid Circuit Test Jig

    SciTech Connect

    Abraham, B.M.; /Fermilab

    1999-04-19

    There are two ways in which the testing may be initiated, remotely or locally. If the remote operation is desired, an external TTL level signal must be provided to the test jig with the remotellocal switch on the side of the test jig switched to remote. A logic high will initiate the test. A logic low will terminate the test. In the event that an external signal is connected to the test jig while local operation occurs, the local control takes precedence over remote control. Once a DVT has been locked in the ZIF socket and the DIP switches are selected, the Push-to-Test button may be depressed. Momentarily depressing the button will initiate a test with a minimum 400 ms duration. At the same time a PBCLOCK and PBLATCH pulses will be initiated and the power rails +12V, +8V, and -6V will be ramped to full voltage. The time at which the power rails reach the full voltage is about 13 ms and it is synchronized with bypass capacitors placed on COMP input of U20 and U22 and on the output of U23 voltage regulators. The voltage rails are supplied to a {+-}10% window comparator. A red LED indicates the rail is below or above 10% of the design value. A green LED indicates the rail is within acceptable limits. For DDT with a 5 pF and 10 pF feed back capacitor, the +12V and +8V rails are current-regulated to 19rnA and 22 rnA respectively and the -6V rail is short-circuit protected within the regulator. For DUT with a 22 pF feed back capacitor the current regulation is the same as above except that the +8V rail is current regulated to 43 rnA. The power rails are supplied to the DUT via a 10 {Omega} resistor. The voltage drop across this resistor is sensed by a differential amplifier AD620 and amplified by a gain of 10. An external BNC connection is provided from this point to allow for current measurements by the vendor. The current value for each rail is calculated by measuring the voltage value at this point and divided by (10*10{Omega}). The next stage inverts and amplifies

  6. Testing self-timed circuits using scan paths

    NASA Technical Reports Server (NTRS)

    Khoche, Ajay; Brunvand, Erik L.

    1993-01-01

    Testing is an essential part of any digital system design and one that can be made much easier if testing is considered during the design process rather than after the system is complete. There are a number of techniques for integrating testability into system design, but many of these traditional testing methods used for synchronous circuits are not directly applicable to non-clocked asynchronous circuits. As a result, many asynchronous circuits do not employ design for testability techniques. A method of using the familiar model of scan paths modified to test self-timed systems are presented. Specifically, circuits designed using a library of self-timed modules to assemble systems with two-phase transition control and bundled data paths are considered. The method involves modifying these self-timed modules such that circuits designed from them have a built-in scan path.

  7. Electrical short circuit and current overload tests on aircraft wiring

    NASA Technical Reports Server (NTRS)

    Cahill, Patricia

    1995-01-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  8. A canonical circuit for generating phase-amplitude coupling.

    PubMed

    Onslow, Angela C E; Jones, Matthew W; Bogacz, Rafal

    2014-01-01

    'Phase amplitude coupling' (PAC) in oscillatory neural activity describes a phenomenon whereby the amplitude of higher frequency activity is modulated by the phase of lower frequency activity. Such coupled oscillatory activity--also referred to as 'cross-frequency coupling' or 'nested rhythms'--has been shown to occur in a number of brain regions and at behaviorally relevant time points during cognitive tasks; this suggests functional relevance, but the circuit mechanisms of PAC generation remain unclear. In this paper we present a model of a canonical circuit for generating PAC activity, showing how interconnected excitatory and inhibitory neural populations can be periodically shifted in to and out of oscillatory firing patterns by afferent drive, hence generating higher frequency oscillations phase-locked to a lower frequency, oscillating input signal. Since many brain regions contain mutually connected excitatory-inhibitory populations receiving oscillatory input, the simplicity of the mechanism generating PAC in such networks may explain the ubiquity of PAC across diverse neural systems and behaviors. Analytic treatment of this circuit as a nonlinear dynamical system demonstrates how connection strengths and inputs to the populations can be varied in order to change the extent and nature of PAC activity, importantly which phase of the lower frequency rhythm the higher frequency activity is locked to. Consequently, this model can inform attempts to associate distinct types of PAC with different network topologies and physiologies in real data. PMID:25136855

  9. Test and inspection for process control of monolithic circuits

    NASA Technical Reports Server (NTRS)

    Spangenberg, E.

    1967-01-01

    Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation.

  10. Documentation of Stainless Steel Lithium Circuit Test Section Design. Suppl

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas J. (Compiler); Martin, James J.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations

  11. Documentation of Stainless Steel Lithium Circuit Test Section Design

    NASA Technical Reports Server (NTRS)

    Godfroy, T. J.; Martin, J. J.; Stewart, E. T.; Rhys, N. O.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.

  12. Addressable-Matrix Integrated-Circuit Test Structure

    NASA Technical Reports Server (NTRS)

    Sayah, Hoshyar R.; Buehler, Martin G.

    1991-01-01

    Method of quality control based on use of row- and column-addressable test structure speeds collection of data on widths of resistor lines and coverage of steps in integrated circuits. By use of straightforward mathematical model, line widths and step coverages deduced from measurements of electrical resistances in each of various combinations of lines, steps, and bridges addressable in test structure. Intended for use in evaluating processes and equipment used in manufacture of application-specific integrated circuits.

  13. Elements configuration of the open lead test circuit

    NASA Astrophysics Data System (ADS)

    Fukuzaki, Yumi; Ono, Akira

    2016-07-01

    In the field of electronics, small electronic devices are widely utilized because they are easy to carry. The devices have various functions by user's request. Therefore, the lead's pitch or the ball's pitch have been narrowed and high-density printed circuit board has been used in the devices. Use of the ICs which have narrow lead pitch makes normal connection difficult. When logic circuits in the devices are fabricated with the state-of-the-art technology, some faults have occurred more frequently. It can be divided into types of open faults and short faults. We have proposed a new test method using a test circuit in the past. This paper propose elements configuration of the test circuit.

  14. Fast physical random bit generation with photonic integrated circuits with different external cavity lengths for chaos generation.

    PubMed

    Takahashi, Rie; Akizawa, Yasuhiro; Uchida, Atsushi; Harayama, Takahisa; Tsuzuki, Ken; Sunada, Satoshi; Arai, Kenichi; Yoshimura, Kazuyuki; Davis, Peter

    2014-05-19

    We generate random bit sequences from chaotic temporal waveforms by using photonic integrated circuits (PICs) with different external cavity lengths. We investigate the condition for generating random bits at different sampling rates of single-bit generation method with the PICs. We succeed in generating certified random bit sequences by using the PIC with 3, 4, 5, or 10-mm-long external cavity, whereas random bits cannot pass all the statistical tests of randomness when the PIC with 1 or 2 mm-long external cavity is used.

  15. Circuit design considerations for regulating energy generated by dielectric elastomer generators

    NASA Astrophysics Data System (ADS)

    Lo, Ho Cheong; Mckay, Thomas; O'Brien, Benjamin M.; Calius, Emilio; Anderson, Iain

    2011-04-01

    Dielectric Elastomer Generator(s) (DEG) have many unique properties that give them advantages over conventional electromagnetic generators. These include the ability to effectively generate power from slow and irregular motions, low cost, relatively large energy density, and a soft and flexible nature. For DEG to generate usable electrical energy circuits for charging (or priming) the stretched DEG and regulating the generated energy when relaxed are required. Most prior art has focused on the priming challenge, and there is currently very little work into developing circuits that address design issues for extracting the electrical energy and converting it into a usable form such as low DC voltages (~10 V) for small batteries or AC mains voltage (~100 V). This paper provides a brief introduction to the problems of regulating the energy generated by DEG. A buck converter and a charge pump are common DC-DC step-down circuits and are used as case studies to explore the design issues inherent in converting the high voltage energy into a form suitable for charging a battery. Buck converters are efficient and reliable but also heavy and bulky, making them suitable for large scale power generation. The smaller and simpler charge pump, though a less effective energy harvester, is better for small and discrete power generation. Future development in miniature DE fabrication is expected to reduce the high operational voltages, simplifying the design of these circuits.

  16. Photonic-integrated circuit for continuous-wave THz generation.

    PubMed

    Theurer, Michael; Göbel, Thorsten; Stanze, Dennis; Troppenz, Ute; Soares, Francisco; Grote, Norbert; Schell, Martin

    2013-10-01

    We demonstrate a photonic-integrated circuit for continuous-wave (cw) terahertz (THz) generation. By comprising two lasers and an optical phase modulator on a single chip, the full control of the THz signal is enabled via a unique bidirectional operation technique. Integrated heaters allow for continuous tuning of the THz frequency over 570 GHz. Applied to a coherent cw THz photomixing system operated at 1.5 μm optical wavelength, we reach a signal-to-noise ratio of 44 dB at 1.25 THz, which is identical to the performance of a standard system based on discrete components.

  17. Dual magnetic circuit magnetic bead coagulation test method

    NASA Astrophysics Data System (ADS)

    Zhu, Lianqing; Wang, Zicai; Guo, Shuangmao; Wang, Jun

    2010-08-01

    This paper presents a dual magnetic circuit magnetic bead method and corresponding system for testing human blood coagulation. The system is composed mainly of a dual magnetic circuit magnetic beads test assembly, a signal modulation and demodulation module, a digital filter as well as a waveform processor. Smart hardware design together with subsequent software algorithm is presented for the system to overcome the defects of traditional dual magnetic circuit magnetic bead method. Experiments for verifying the system are carried out in comparison with an ACL200 coagulometer from Coulter Co. USA. Experimental results indicate that the system features excellent precision, repeatability better than 2.10%, and show that the dual magnetic circuit magnetic bead system suppresses external interference factors effectively.

  18. A test circuit for capacitor bank grounding sticks

    NASA Astrophysics Data System (ADS)

    Hummer, C. R.; Mahan, K. A.; Hollandsworth, C. E.

    1992-06-01

    After completion of a charge-discharge cycle, energy-storage capacitor banks must be shorted to ground and the short maintained before the bank can be safely approached by an operator. It is essential that the grounding stick used by the operator to drain any residual charge have a proper electrical resistance. A test unit has been constructed and tested which checks the grounding circuit for proper resistance and provides a visual indication of its status. This unit also includes an auxiliary circuit which sounds an audible warning when an excessive current passes through the grounding circuit. The enhanced measure of safety which such a circuit could provide is illustrated by discussion of a recent capacitor-bank accident at Aberdeen Proving Ground, MD.

  19. Lightning simulator circuit parameters and performance for severe-threat, high-action-integral testing

    NASA Astrophysics Data System (ADS)

    White, R. A.

    The lightning simulator at Sandia National Laboratories was used to subject a number of DOE and military test items to severe levels of simulated lightning. Some example circuits and circuit parameters are discussed in relation to tests made with this crowbarred Mary-generator type simulator. Examples of fast rising, high peak, long duration simulated lightning currents that were produced into full size test items are presented. Peak currents up to 250 kA with 1-(MU)s rise times and action values up to greater than 6 million A(2)s was injected into various test systems.

  20. Extended life testing evaluation of complementary MOS integrated circuits

    NASA Technical Reports Server (NTRS)

    Brosnan, T. E.

    1972-01-01

    The purpose of the extended life testing evaluation of complementary MOS integrated circuits was twofold: (1) To ascertain the long life capability of complementary MOS devices. (2) To assess the objectivity and reliability of various accelerated life test methods as an indication or prediction tool. In addition, the determination of a suitable life test sequence for these devices was of importance. Conclusions reached based on the parts tested and the test results obtained was that the devices were not acceptable.

  1. On Parameterization of the Global Electric Circuit Generators

    NASA Astrophysics Data System (ADS)

    Slyunyaev, N. N.; Zhidkov, A. A.

    2016-08-01

    We consider the problem of generator parameterization in the global electric circuit (GEC) models. The relationship between the charge density and external current density distributions inside a thundercloud is studied using a one-dimensional description and a three-dimensional GEC model. It is shown that drastic conductivity variations in the vicinity of the cloud boundaries have a significant impact on the structure of the charge distribution inside the cloud. Certain restrictions on the charge density distribution in a realistic thunderstorm are found. The possibility to allow for conductivity inhomogeneities in the thunderstorm regions by introducing an effective external current density is demonstrated. Replacement of realistic thunderstorms with equivalent current dipoles in the GEC models is substantiated, an equation for the equivalent current is obtained, and the applicability range of this equation is analyzed. Relationships between the main GEC characteristics under variable parameterization of GEC generators are discussed.

  2. Ring Counter Based ATPG for Low Transition Test Pattern Generation

    PubMed Central

    Begam, V. M. Thoulath; Baulkani, S.

    2015-01-01

    In test mode test patterns are applied in random fashion to the circuit under circuit. This increases switching transition between the consecutive test patterns and thereby increases dynamic power dissipation. The proposed ring counter based ATPG reduces vertical switching transitions by inserting test vectors only between the less correlative test patterns. This paper presents the RC-ATPG with an external circuit. The external circuit consists of XOR gates, full adders, and multiplexers. First the total number of transitions between the consecutive test patterns is determined. If it is more, then the external circuit generates and inserts test vectors in between the two test patterns. Test vector insertion increases the correlation between the test patterns and reduces dynamic power dissipation. The results prove that the test patterns generated by the proposed ATPG have fewer transitions than the conventional ATPG. Experimental results based on ISCAS'85 and ISCAS'89 benchmark circuits show 38.5% reduction in the average power and 50% reduction in the peak power attained during testing with a small size decoding logic. PMID:26075295

  3. Distinct rhythmic locomotor patterns can be generated by a simple adaptive neural circuit: biology, simulation, and VLSI implementation.

    PubMed

    Ryckebusch, S; Wehr, M; Laurent, G

    1994-12-01

    Rhythmic motor patterns can be induced in leg motor neurons of isolated locust thoracic ganglia by bath application of pilocarpine. We observed that the relative phases of levators and depressors differed in the three thoracic ganglia. Assuming that the central pattern generating circuits underlying these three segmental rhythms are probably very similar, we developed a simple model circuit that can produce any one of the three activity patterns and characteristic phase relationships by modifying a single synaptic weight. We show results of a computer simulation of this circuit using the neuronal simulator NeuraLOG/Spike. We built and tested an analog VLSI circuit implementation of this model circuit that exhibits the same range of "behaviors" as the computer simulation. This multidisciplinary strategy will be useful to explore the dynamics of central pattern generating networks coupled to physical actuators, and ultimately should allow the design of biologically realistic walking robots.

  4. Standard Transistor Array (STAR). Volume 2: Test pattern generation

    NASA Technical Reports Server (NTRS)

    Carroll, B. D.

    1979-01-01

    Testing of large scale integrated logic circuits is considered from the point-of-view of automatic test pattern generation. A logic simulator based approach for automatic test pattern generation is taken and is described. The logic model and the timing model used in the simulator are also described. Two methods are presented for generating test patterns from the output of the simulator. Recommendations for future study are also presented.

  5. A Testing System for Diagnosing Misconceptions in DC Electric Circuits.

    ERIC Educational Resources Information Center

    Chang, Kuo-En; Liu, Sei-Hua; Chen, Sei-Wang

    1998-01-01

    Outlines a test-based diagnosis system for misconceptions in DC electric circuits and its three parts: problem library, problem selector and diagnoser. Discusses misconception discrimination and diagnosis theories, and reports the system supports satisfactory diagnosis. Includes an analysis of nine student misconceptions about electrical circuits…

  6. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of...

  7. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of...

  8. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of...

  9. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of...

  10. High voltage generator circuit with low power and high efficiency applied in EEPROM

    NASA Astrophysics Data System (ADS)

    Yan, Liu; Shilin, Zhang; Yiqiang, Zhao

    2012-06-01

    This paper presents a low power and high efficiency high voltage generator circuit embedded in electrically erasable programmable read-only memory (EEPROM). The low power is minimized by a capacitance divider circuit and a regulator circuit using the controlling clock switch technique. The high efficiency is dependent on the zero threshold voltage (Vth) MOSFET and the charge transfer switch (CTS) charge pump. The proposed high voltage generator circuit has been implemented in a 0.35 μm EEPROM CMOS process. Measured results show that the proposed high voltage generator circuit has a low power consumption of about 150.48 μW and a higher pumping efficiency (83.3%) than previously reported circuits. This high voltage generator circuit can also be widely used in low-power flash devices due to its high efficiency and low power dissipation.

  11. Radiation Testing and Evaluation Issues for Modern Integrated Circuits

    NASA Technical Reports Server (NTRS)

    LaBel, Kenneth A.; Cohn, Lew M.

    2005-01-01

    Abstract. Changes in modern integrated circuit (IC) technologies have modified the way we approach and conduct radiation tolerance and testing of electronics. These changes include scaling of geometries, new materials, new packaging technologies, and overall speed and device complexity challenges. In this short course section, we will identify and discuss these issues as they impact radiation testing, modeling, and effects mitigation of modern integrated circuits. The focus will be on CMOS-based technologies, however, other high performance technologies will be discussed where appropriate. The effects of concern will be: Single-Event Effects (SEE) and steady state total ionizing dose (TID) IC response. However, due to the growing use of opto-electronics in space systems issues concerning displacement damage testing will also be considered. This short course section is not intended to provide detailed "how-to-test" information, but simply provide a snapshot of current challenges and some of the approaches being considered.

  12. Improved waveform generator and cardiac simulator for sensitivity testing of ventricular programmed pulse generator.

    PubMed

    Wiegand, D A; Tyers, G F; Brownlee, R R

    1978-01-01

    The need for an easily generated, simulated QRS complex to facilitate preimplantation sensitivity testing of ventricular programmed pacemakers has led to the adoption of the sine squared waveform as the standard test pulse, by the Pacemaker Standards Subcommitte of the Association for the Advancement of Medical Instrumentation (AAMI). A simple circuit is presented that provides an accurate sine squared pulse with easily adjustable pulse width (base frequency). A suggested circuit for incorporating this sine squared pulse generator into a complete pacemaker test waveform generator/cardiac simulator is also presented.

  13. Laser system for testing radiation imaging detector circuits

    NASA Astrophysics Data System (ADS)

    Zubrzycka, Weronika; Kasinski, Krzysztof

    2015-09-01

    Performance and functionality of radiation imaging detector circuits in charge and position measurement systems need to meet tight requirements. It is therefore necessary to thoroughly test sensors as well as read-out electronics. The major disadvantages of using radioactive sources or particle beams for testing are high financial expenses and limited accessibility. As an alternative short pulses of well-focused laser beam are often used for preliminary tests. There are number of laser-based devices available on the market, but very often their applicability in this field is limited. This paper describes concept, design and validation of laser system for testing silicon sensor based radiation imaging detector circuits. The emphasis is put on keeping overall costs low while achieving all required goals: mobility, flexible parameters, remote control and possibility of carrying out automated tests. The main part of the developed device is an optical pick-up unit (OPU) used in optical disc drives. The hardware includes FPGA-controlled circuits for laser positioning in 2 dimensions (horizontal and vertical), precision timing (frequency and number) and amplitude (diode current) of short ns-scale (3.2 ns) light pulses. The system is controlled via USB interface by a dedicated LabVIEW-based application enabling full manual or semi-automated test procedures.

  14. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... causes the circuit breaker to open, shall be considered a proper test. All components of the circuit... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination,...

  15. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... causes the circuit breaker to open, shall be considered a proper test. All components of the circuit... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination,...

  16. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... causes the circuit breaker to open, shall be considered a proper test. All components of the circuit... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination,...

  17. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... causes the circuit breaker to open, shall be considered a proper test. All components of the circuit... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination,...

  18. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... causes the circuit breaker to open, shall be considered a proper test. All components of the circuit... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination,...

  19. Relay test program. Series 2 tests: Integral testing of relays and circuit breakers

    SciTech Connect

    Bandyopadhyay, K.K.; Kunkel, C.; Shteyngart, S.

    1994-02-01

    This report presents the results of a relay test program conducted by Brookhaven National Laboratory (BNL) under the sponsorship of the US Nuclear Regulatory Commission (NRC). The program is a continuation of an earlier test program the results of which were published in NUREG/CR-4867. The current program was carried out in two phases: electrical testing and vibration testing. The objective was primarily to focus on the electrical discontinuity or continuity of relays and circuit breaker tripping mechanisms subjected to electrical pulses and vibration loads. The electrical testing was conducted by KEMA-Powertest Company and the vibration testing was performed at Wyle Laboratories, Huntsville, Alabama. This report discusses the test procedures, presents the test data, includes an analysis of the data and provides recommendations regarding reliable relay testing.

  20. Statistical tests for closure of plate motion circuits

    NASA Technical Reports Server (NTRS)

    Gordon, Richard G.; Stein, Seth; Demets, Charles; Argus, Donald F.

    1987-01-01

    Two methods, one based on a chi-square test and the second on an F-ratio test, of testing for the plate motion circuit closures are described and evaluated. The chi-square test is used to evaluate goodness of fit, and it is assumed that the assigned errors are accurate estimates of the true errors in the data. The F-ratio test is used to compare variances of distributions, and it is assumed that the relative values of assigned error are accurate. The two methods are applied to the data of Minster and Jordan (1978) on the motion of the three plates that meet at the Galapagos Triple Junction, and the motion of the three plates that meet at the Indian Ocean Triple Junction. It is noted that the F-ratio plate circuit closure test is more useful than the chi-square test for identifying systematic misfits in data because the chi-square test overestimates the errors of plate motion data.

  1. Universal nondestructive mm-wave integrated circuit test fixture

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert R. (Inventor); Shalkhauser, Kurt A. (Inventor)

    1990-01-01

    Monolithic microwave integrated circuit (MMIC) test includes a bias module having spring-loaded contacts which electrically engage pads on a chip carrier disposed in a recess of a base member. RF energy is applied to and passed from the chip carrier by chamfered edges of ridges in the waveguide passages of housings which are removably attached to the base member. Thru, Delay, and Short calibration standards having dimensions identical to those of the chip carrier assure accuracy and reliability of the test. The MMIC chip fits in an opening in the chip carrier with the boundaries of the MMIC lying on movable reference planes thereby establishing accuracy and flexibility.

  2. A Digital Coreless Maximum Power Point Tracking Circuit for Thermoelectric Generators

    NASA Astrophysics Data System (ADS)

    Kim, Shiho; Cho, Sungkyu; Kim, Namjae; Baatar, Nyambayar; Kwon, Jangwoo

    2011-05-01

    This paper describes a maximum power point tracking (MPPT) circuit for thermoelectric generators (TEG) without a digital controller unit. The proposed method uses an analog tracking circuit that samples the half point of the open-circuit voltage without a digital signal processor (DSP) or microcontroller unit for calculating the peak power point using iterative methods. The simulation results revealed that the MPPT circuit, which employs a boost-cascaded-with-buck converter, handled rapid variation of temperature and abrupt changes of load current; this method enables stable operation with high power transfer efficiency. The proposed MPPT technique is a useful analog MPPT solution for thermoelectric generators.

  3. Capabilities and Testing of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK), which was used in the SNAP-10A fission reactor, was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around a 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. NaK flow rates of greater than 1 kg/sec may be achieved, depending upon the power applied to the EM pump. The heat exchanger provides for the removal of thermal energy from the circuit, simulating the presence of an energy conversion system. The presence of the test section increases the versatility of the circuit. A second liquid metal pump, an energy conversion system, and highly instrumented thermal simulators are all being considered for inclusion within the test section. This paper summarizes the capabilities and ongoing testing of the Fission Surface Power Primary Test Circuit (FSP-PTC).

  4. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-2 Testing... test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits....

  5. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-2 Testing... test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits....

  6. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-2 Testing... test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits....

  7. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-2 Testing... test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits....

  8. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least...

  9. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least...

  10. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least...

  11. Device for testing continuity and/or short circuits in a cable

    NASA Technical Reports Server (NTRS)

    Hayhurst, Arthur R. (Inventor)

    1995-01-01

    A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of the cable. The pair of connectors electrically connects the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

  12. Apparatus and method for defect testing of integrated circuits

    DOEpatents

    Cole, Jr., Edward I.; Soden, Jerry M.

    2000-01-01

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V.sub.DD, to an IC under test and measures a transient voltage component, V.sub.DDT, signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V.sub.DDT signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V.sub.DDT signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  13. Apparatus and method for defect testing of integrated circuits

    SciTech Connect

    Cole, E.I. Jr.; Soden, J.M.

    2000-02-29

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V(DD), to an IC under test and measures a transient voltage component, V(DDT), signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V(DDT) signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V(DDT) signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  14. Series and parallel arc-fault circuit interrupter tests.

    SciTech Connect

    Johnson, Jay Dean; Fresquez, Armando J.; Gudgel, Bob; Meares, Andrew

    2013-07-01

    While the 2011 National Electrical Codeª (NEC) only requires series arc-fault protection, some arc-fault circuit interrupter (AFCI) manufacturers are designing products to detect and mitigate both series and parallel arc-faults. Sandia National Laboratories (SNL) has extensively investigated the electrical differences of series and parallel arc-faults and has offered possible classification and mitigation solutions. As part of this effort, Sandia National Laboratories has collaborated with MidNite Solar to create and test a 24-string combiner box with an AFCI which detects, differentiates, and de-energizes series and parallel arc-faults. In the case of the MidNite AFCI prototype, series arc-faults are mitigated by opening the PV strings, whereas parallel arc-faults are mitigated by shorting the array. A range of different experimental series and parallel arc-fault tests with the MidNite combiner box were performed at the Distributed Energy Technologies Laboratory (DETL) at SNL in Albuquerque, NM. In all the tests, the prototype de-energized the arc-faults in the time period required by the arc-fault circuit interrupt testing standard, UL 1699B. The experimental tests confirm series and parallel arc-faults can be successfully mitigated with a combiner box-integrated solution.

  15. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  16. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  17. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  18. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  19. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be... service time obtained on this test will be used to classify the open-circuit apparatus in accordance...

  20. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit... wearer during man test No. 4 described in Table 4 of this subpart. (b) The service time obtained on...

  1. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit... wearer during man test No. 4 described in Table 4 of this subpart. (b) The service time obtained on...

  2. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be... service time obtained on this test will be used to classify the open-circuit apparatus in accordance...

  3. Multiple-circuit pulse generator for high repetition rate rare gas halide lasers.

    PubMed

    Wang, C P

    1978-10-01

    A multiple-circuit high pulse repetition frequency (PRF) pulse generator for the pumping of rare gas halide lasers is reported. With this multiple-circuit design, high PRF can be achieved by the use of existing low PRF thyratron switches and capacitors. A two-circuit pulse generator was constructed, and its performance is described. By means of this pulse generator and a blowdown-type fast transverse-flow system, high PRF laser action in XeF was obtained, typically, 6 mJ/pulse at 1 kHz or 6 W average power. High PRF laser action in N(2) was also observed.

  4. Test Generator for MATLAB Simulations

    NASA Technical Reports Server (NTRS)

    Henry, Joel

    2011-01-01

    MATLAB Automated Test Tool, version 3.0 (MATT 3.0) is a software package that provides automated tools that reduce the time needed for extensive testing of simulation models that have been constructed in the MATLAB programming language by use of the Simulink and Real-Time Workshop programs. MATT 3.0 runs on top of the MATLAB engine application-program interface to communicate with the Simulink engine. MATT 3.0 automatically generates source code from the models, generates custom input data for testing both the models and the source code, and generates graphs and other presentations that facilitate comparison of the outputs of the models and the source code for the same input data. Context-sensitive and fully searchable help is provided in HyperText Markup Language (HTML) format.

  5. Soft-error generation due to heavy-ion tracks in bipolar integrated circuits

    NASA Technical Reports Server (NTRS)

    Zoutendyk, J. A.

    1984-01-01

    Both bipolar and MOS integrated circuits have been empirically demonstrated to be susceptible to single-particle soft-error generation, commonly referred to as single-event upset (SEU), which is manifested in a bit-flip in a latch-circuit construction. Here, the intrinsic characteristics of SEU in bipolar (static) RAM's are demonstrated through results obtained from the modeling of this effect using computer circuit-simulation techniques. It is shown that as the dimensions of the devices decrease, the critical charge required to cause SEU decreases in proportion to the device cross-section. The overall results of the simulations are applicable to most integrated circuit designs.

  6. Testing interconnected VLSI circuits in the Big Viterbi Decoder

    NASA Technical Reports Server (NTRS)

    Onyszchuk, I. M.

    1991-01-01

    The Big Viterbi Decoder (BVD) is a powerful error-correcting hardware device for the Deep Space Network (DSN), in support of the Galileo and Comet Rendezvous Asteroid Flyby (CRAF)/Cassini Missions. Recently, a prototype was completed and run successfully at 400,000 or more decoded bits per second. This prototype is a complex digital system whose core arithmetic unit consists of 256 identical very large scale integration (VLSI) gate-array chips, 16 on each of 16 identical boards which are connected through a 28-layer, printed-circuit backplane using 4416 wires. Special techniques were developed for debugging, testing, and locating faults inside individual chips, on boards, and within the entire decoder. The methods are based upon hierarchical structure in the decoder, and require that chips or boards be wired themselves as Viterbi decoders. The basic procedure consists of sending a small set of known, very noisy channel symbols through a decoder, and matching observables against values computed by a software simulation. Also, tests were devised for finding open and short-circuited wires which connect VLSI chips on the boards and through the backplane.

  7. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Testing, examination and maintenance of circuit... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit...

  8. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Testing, examination and maintenance of circuit... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit...

  9. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Testing, examination and maintenance of circuit... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit...

  10. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Testing, examination and maintenance of circuit... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit...

  11. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Testing, examination and maintenance of circuit... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit...

  12. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  13. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  14. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  15. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  16. Low energy ohmmeter can be used to test sensitive circuits, other meters

    NASA Technical Reports Server (NTRS)

    Platt, L. W.

    1968-01-01

    Hazardous circuit ohmmeter is of sufficiently low energy output that it may be used to test extremely sensitive circuits safely, reliably, and accurately. A polyurethane-foam-lined aluminum case provided protection for the unit assembly.

  17. 37. SAR2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    37. SAR-2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD COIL CONTROL RHEOSTATS (BELOW). SCE negative no. 10331, November 1, 1923. Photograph by G. Haven Bishop. - Santa Ana River Hydroelectric System, SAR-2 Powerhouse, Redlands, San Bernardino County, CA

  18. Dynamic control of a central pattern generator circuit: a computational model of the snail feeding network.

    PubMed

    Vavoulis, Dimitris V; Straub, Volko A; Kemenes, Ildikó; Kemenes, György; Feng, Jianfeng; Benjamin, Paul R

    2007-05-01

    Central pattern generators (CPGs) are networks underlying rhythmic motor behaviours and they are dynamically regulated by neuronal elements that are extrinsic or intrinsic to the rhythmogenic circuit. In the feeding system of the pond snail, Lymnaea stagnalis, the extrinsic slow oscillator (SO) interneuron controls the frequency of the feeding rhythm and the N3t (tonic) has a dual role; it is an intrinsic CPG interneuron, but it also suppresses CPG activity in the absence of food, acting as a decision-making element in the feeding circuit. The firing patterns of the SO and N3t neurons and their synaptic connections with the rest of the CPG are known, but how these regulate network function is not well understood. This was investigated by building a computer model of the feeding network based on a minimum number of cells (N1M, N2v and N3t) required to generate the three-phase motor rhythm together with the SO that was used to activate the system. The intrinsic properties of individual neurons were represented using two-compartment models containing currents of the Hodgkin-Huxley type. Manipulations of neuronal activity in the N3t and SO neurons in the model produced similar quantitative effects to food and electrical stimulation in the biological network indicating that the model is a useful tool for studying the dynamic properties of the feeding circuit. The model also predicted novel effects of electrical stimulation of two CPG interneurons (N1M and N2v). When tested experimentally, similar effects were found in the biological system providing further validation of our model.

  19. A test technique for measuring lightning-induced voltages on aircraft electrical circuits

    NASA Technical Reports Server (NTRS)

    Walko, L. C.

    1974-01-01

    The development of a test technique used for the measurement of lightning-induced voltages in the electrical circuits of a complete aircraft is described. The resultant technique utilizes a portable device known as a transient analyzer capable of generating unidirectional current impulses similar to lightning current surges, but at a lower current level. A linear relationship between the magnitude of lightning current and the magnitude of induced voltage permitted the scaling up of measured induced values to full threat levels. The test technique was found to be practical when used on a complete aircraft.

  20. Design and testing of integrated circuits for reactor protection channels

    SciTech Connect

    Battle, R.E.; Vandermolen, R.I.; Jagadish, U.; Swail, B.K.; Naser, J.; Rana, I.

    1995-06-01

    Custom and semicustom application-specific integrated circuit design and testing methods are investigated for use in research and commercial nuclear reactor safety systems. The Electric Power Research Institute and Oak Ridge National Laboratory are working together through a cooperative research and development agreement to apply modern technology to a nuclear reactor protection system. Purpose of this project is to demonstrate to the nuclear industry an alternative approach for new or upgrade reactor protection and safety system signal processing and voting logic. Motivation for this project stems from (1) the difficulty of proving that software-based protection systems are adequately reliable, (2) the obsolescence of the original equipment, and (3) the improved performance of digital processing.

  1. Design and testing of integrated circuits for reactor protection channels

    SciTech Connect

    Battle, R.E.; Vandermolen, R.I.; Jagadish, U.; Swail, B.K.; Naser, J.

    1995-06-01

    Custom and semicustom application-specific integrated circuit design and testing methods are investigated for use in research and commercial nuclear reactor safety systems. The Electric Power Research Institute and Oak Ridge National Laboratory are working together through a cooperative research and development agreement to apply modern technology to a nuclear reactor protection system. The purpose of this project is to demonstrate to the nuclear industry an alternative approach for new or upgrade reactor protection and safety system signal processing and voting logic. Motivation for this project stems from (1) the difficulty of proving that software-based protection systems are adequately reliable, (2) the obsolescence of the original equipment, and (3) the improved performance of digital processing. A demonstration model for protection system of PWR reactor has been designed and built.

  2. Research of 100 MHz ultra-low-jitter clock generating circuit

    SciTech Connect

    Qiu, Duyu; Tan, Feng; Tian, Shulin; Zeng, Hao; Ye, Peng

    2015-04-15

    Jitter which quantifies the quality of a clock is an important specification. It is of great significance for an electronic system. To obtain a good signal-to-noise ratio for sampling systems, there must be clocks with low jitter performances. By using the relationship between jitter and phase noise, the 100 MHz clock generating circuit with ultra-low jitter and phase noise characteristics are studied in this paper. Bipolar junction transistor with low noise figure and low corner frequency should be selected. Inductance and capacitance in the feedback circuit are obviously the main contributions to the jitter. Impacts of the loaded quality factor (Q{sub L}) of the circuit on the jitter are analyzed, and the explicit expression for the jitter based on circuit components is derived as well. The simulation and experiment results are proved to show that the jitter and phase noise characteristics can be improved by increasing Q{sub L} of the circuit.

  3. The generation effect: activating broad neural circuits during memory encoding.

    PubMed

    Rosner, Zachary A; Elman, Jeremy A; Shimamura, Arthur P

    2013-01-01

    The generation effect is a robust memory phenomenon in which actively producing material during encoding acts to improve later memory performance. In a functional magnetic resonance imaging (fMRI) analysis, we explored the neural basis of this effect. During encoding, participants generated synonyms from word-fragment cues (e.g., GARBAGE-W_ST_) or read other synonym pairs (e.g., GARBAGE-WASTE). Compared to simply reading target words, generating target words significantly improved later recognition memory performance. During encoding, this benefit was associated with a broad neural network that involved both prefrontal (inferior frontal gyrus, middle frontal gyrus) and posterior cortex (inferior temporal gyrus, lateral occipital cortex, parahippocampal gyrus, ventral posterior parietal cortex). These findings define the prefrontal-posterior cortical dynamics associated with the mnemonic benefits underlying the generation effect.

  4. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, L.B.

    1998-08-18

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

  5. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, Lowell B.

    1998-01-01

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.

  6. Modeling self-priming circuits for dielectric elastomer generators towards optimum voltage boost

    NASA Astrophysics Data System (ADS)

    Zanini, Plinio; Rossiter, Jonathan; Homer, Martin

    2016-04-01

    One of the main challenges for the practical implementation of dielectric elastomer generators (DEGs) is supplying high voltages. To address this issue, systems using self-priming circuits (SPCs) — which exploit the DEG voltage swing to increase its supplied voltage — have been used with success. A self-priming circuit consists of a charge pump implemented in parallel with the DEG circuit. At each energy harvesting cycle, the DEG receives a low voltage input and, through an almost constant charge cycle, generates a high voltage output. SPCs receive the high voltage output at the end of the energy harvesting cycle and supply it back as input for the following cycle, using the DEG as a voltage multiplier element. Although rules for designing self-priming circuits for dielectric elastomer generators exist, they have been obtained from intuitive observation of simulation results and lack a solid theoretical foundation. Here we report the development of a mathematical model to predict voltage boost using self-priming circuits. The voltage on the DEG attached to the SPC is described as a function of its initial conditions, circuit parameters/layout, and the DEG capacitance. Our mathematical model has been validated on an existing DEG implementation from the literature, and successfully predicts the voltage boost for each cycle. Furthermore, it allows us to understand the conditions for the boost to exist, and obtain the design rules that maximize the voltage boost.

  7. Modifications and Modelling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Ann E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of the Single Flow Cell Test Apparatus (SFCTA) in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. The SFCTA, which will be tested simultaneously, will provide data on alkali metal flow behavior through the simulated core channels and assist in the development of a second generation thermal simulator. Additionally, data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  8. Design and implementation of therapeutic ultrasound generating circuit for dental tissue formation and tooth-root healing.

    PubMed

    Woon Tiong Ang; Scurtescu, C; Wing Hoy; El-Bialy, T; Ying Yin Tsui; Jie Chen

    2010-02-01

    Biological tissue healing has recently attracted a great deal of research interest in various medical fields. Trauma to teeth, deep and root caries, and orthodontic treatment can all lead to various degrees of root resorption. In our previous study, we showed that low-intensity pulsed ultrasound (LIPUS) enhances the growth of lower incisor apices and accelerates their rate of eruption in rabbits by inducing dental tissue growth. We also performed clinical studies and demonstrated that LIPUS facilitates the healing of orthodontically induced teeth-root resorption in humans. However, the available LIPUS devices are too large to be used comfortably inside the mouth. In this paper, the design and implementation of a low-power LIPUS generator is presented. The generator is the core of the final intraoral device for preventing tooth root loss and enhancing tooth root tissue healing. The generator consists of a power-supply subsystem, an ultrasonic transducer, an impedance-matching circuit, and an integrated circuit composed of a digital controller circuitry and the associated driver circuit. Most of our efforts focus on the design of the impedance-matching circuit and the integrated system-on-chip circuit. The chip was designed and fabricated using 0.8- ¿m high-voltage technology from Dalsa Semiconductor, Inc. The power supply subsystem and its impedance-matching network are implemented using discrete components. The LIPUS generator was tested and verified to function as designed and is capable of producing ultrasound power up to 100 mW in the vicinity of the transducer's resonance frequency at 1.5 MHz. The power efficiency of the circuitry, excluding the power supply subsystem, is estimated at 70%. The final products will be tailored to the exact size of teeth or biological tissue, which is needed to be used for stimulating dental tissue (dentine and cementum) healing.

  9. Detailed Pseudo-Static Drive Train Modelling with Generator Short Circuit

    NASA Astrophysics Data System (ADS)

    Warnock, Christopher; Infield, David

    2016-09-01

    Drivetrain failures contribute significantly to wind turbine downtime. Although the root causes of these failures are not yet fully understood, transient events are regarded as an important contributory factor. Despite extensive drive train modelling, limited work has been carried out to assess the impact of a generator short circuit on the drivetrain. In most cases, a generator short circuit is classed as a failure in itself with minimal focus on the subsequent effects on the gearbox and other drivetrain components. This paper will look to analyse the loading on the drivetrain for a doubly fed induction generator (DFIG) short circuit event with turbine ride through using a combination of Simulink, Garrad Hassan's Bladed and RomaxWind drive train modelling software.

  10. Test results of a 90 MHZ integrated circuit sixteen channel analog pipeline for SSC detector calorimetry

    SciTech Connect

    Kleinfelder, S.A.; Levi, M.; Milgrome, O.

    1990-10-01

    A sixteen channel analog transient recorder with 128 cells per channel has been fabricated as an integrated circuit and tested at speeds of up to 90 MHz. The circuit uses a switched capacitor array technology to achieve a simultaneous read and write capability and twelve bit dynamic range. The high performance of this part should satisfy the demanding electronics requirements of calorimeter detectors at the SSC. The circuit parameters and test results are presented. 2 refs., 3 figs., 1 tab.

  11. Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

    NASA Technical Reports Server (NTRS)

    Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

    2003-01-01

    The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

  12. Performance testing of thermoelectric generators at JPL

    NASA Technical Reports Server (NTRS)

    Rouklove, P.; Truscello, V.

    1974-01-01

    Results of life tests of thermoelectric generators ranging in output power from 800 microwatts to 170 watts. Emphasis is placed on the results obtained from tests of three advanced prototypes - a high-performance generator, a transit-type generator, and a ring converter. In addition, the results of life tests of a number of generators representing Nimbus, Pioneer, and Viking technology are presented.

  13. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand...

  14. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand...

  15. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied by a constant-flow device only, the rate of flow shall be at least 3 liters per minute for the...

  16. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied by a constant-flow device only, the rate of flow shall be at least 3 liters per minute for the...

  17. A versatile waveform generator for testing neuroelectric signal processors.

    PubMed

    Kohn, A F

    1989-08-01

    A multi-channel waveform generator was designed for testing neuroelectric signal processors. Smooth transient signals that resemble action potentials or evoked potentials are generated by a second order switched capacitor filter excited by brief rectangular pulses. The choice of an integrated circuit switched capacitor filter simplified the design by circumventing some of the disadvantages of conventional active filters. The waveform generator is versatile, with several signal parameters being independently adjustable from front panel controls: duration, waveshape, latency, amplitude and signal-to-noise ratio. The generator has been used for testing evoked potential acquisition and processing systems, for evaluating the effects of analog filters on evoked potentials and for testing systems designed to detect and classify trains of multi-unit action potentials. PMID:2770339

  18. A versatile waveform generator for testing neuroelectric signal processors.

    PubMed

    Kohn, A F

    1989-08-01

    A multi-channel waveform generator was designed for testing neuroelectric signal processors. Smooth transient signals that resemble action potentials or evoked potentials are generated by a second order switched capacitor filter excited by brief rectangular pulses. The choice of an integrated circuit switched capacitor filter simplified the design by circumventing some of the disadvantages of conventional active filters. The waveform generator is versatile, with several signal parameters being independently adjustable from front panel controls: duration, waveshape, latency, amplitude and signal-to-noise ratio. The generator has been used for testing evoked potential acquisition and processing systems, for evaluating the effects of analog filters on evoked potentials and for testing systems designed to detect and classify trains of multi-unit action potentials.

  19. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-1 Testing... protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least...

  20. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Surface High-Voltage Distribution § 77.800-1 Testing... protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least...

  1. A deterministic BIST scheme for test time reduction in VLSI circuits

    NASA Astrophysics Data System (ADS)

    Solana, Jose M.

    2005-06-01

    A Built-In Self-Test scheme for VLSI scan-based digital circuits, capable of considerably reducing the number of test cycles, is presented. The core circuit structure consists of a modification of the original scan-based circuit requiring no extra I/O pin. Only a moderate area increment is used to accommodate the extra test circuitry. The structure does not use scan-out, but scan-in exclusively, which implies that the complete circuit responses are observed through the circuit primary-outputs. Based on this structure, a deterministic ROM-based Built-In Self-Test scheme has been developed. In this scheme, the circuit responses are compressed in a Multiple-Input Signature Register. Deterministic test patterns are stored in two ROMs. The first stores the sub-patterns to be serially loaded into the scan chain, while the second stores the sub-patterns to be applied in parallel to the circuit primary inputs. All the control bits for clocks and for selecting the loading of a new sub-pattern into the scan chain are also included in this last ROM. Thus, the clocks and the select-mode input are the only external inputs to the scheme. The comparison of the proposed scheme with a similar one, based on the classical full single-serial scan-path, for a set of benchmark circuits, shows a 19% reduction in ROM-bits, while a reduction of over 45% in the test time is obtained.

  2. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator.

    PubMed

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results.

  3. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator.

    PubMed

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results. PMID:25725867

  4. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator

    NASA Astrophysics Data System (ADS)

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results.

  5. Student-Generated Assignments about Electrical Circuits in a Computer Simulation

    ERIC Educational Resources Information Center

    Vreman-de Olde, Cornelise; de Jong, Ton

    2004-01-01

    In this study we investigated the design of assignments by students as a knowledge-generating activity. Students were required to design assignments for 'other students' in a computer simulation environment about electrical circuits. Assignments consisted of a question, alternatives, and feedback on those alternatives. In this way, subjects were…

  6. Test Writing Made Simple: Generate Tests and Worksheets Electronically.

    ERIC Educational Resources Information Center

    Lodish, Erica

    1986-01-01

    Describes capabilities of test and worksheet generator software; discusses features to consider when evaluating the software for purchase; and presents reviews of eight test and worksheet generators: P.D.Q., Testmaster, Easy Quiz Maker, EA Mathematics Worksheet Generator, Mathematics Worksheet Generator, Earth Science Test Maker, Individualized…

  7. Split-cross-bridge resistor for testing for proper fabrication of integrated circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G. (Inventor)

    1985-01-01

    An electrical testing structure and method is described whereby a test structure is fabricated on a large scale integrated circuit wafer along with the circuit components and has a van der Pauw cross resistor in conjunction with a bridge resistor and a split bridge resistor, the latter having two channels each a line width wide, corresponding to the line width of the wafer circuit components, and with the two channels separated by a space equal to the line spacing of the wafer circuit components. The testing structure has associated voltage and current contact pads arranged in a two by four array for conveniently passing currents through the test structure and measuring voltages at appropriate points to calculate the sheet resistance, line width, line spacing, and line pitch of the circuit components on the wafer electrically.

  8. Dynamics of coupled simplest chaotic two-component electronic circuits and its potential application to random bit generation

    SciTech Connect

    Modeste Nguimdo, Romain; Tchitnga, Robert; Woafo, Paul

    2013-12-15

    We numerically investigate the possibility of using a coupling to increase the complexity in simplest chaotic two-component electronic circuits operating at high frequency. We subsequently show that complex behaviors generated in such coupled systems, together with the post-processing are suitable for generating bit-streams which pass all the NIST tests for randomness. The electronic circuit is built up by unidirectionally coupling three two-component (one active and one passive) oscillators in a ring configuration through resistances. It turns out that, with such a coupling, high chaotic signals can be obtained. By extracting points at fixed interval of 10 ns (corresponding to a bit rate of 100 Mb/s) on such chaotic signals, each point being simultaneously converted in 16-bits (or 8-bits), we find that the binary sequence constructed by including the 10(or 2) least significant bits pass statistical tests of randomness, meaning that bit-streams with random properties can be achieved with an overall bit rate up to 10×100 Mb/s =1Gbit/s (or 2×100 Mb/s =200 Megabit/s). Moreover, by varying the bias voltages, we also investigate the parameter range for which more complex signals can be obtained. Besides being simple to implement, the two-component electronic circuit setup is very cheap as compared to optical and electro-optical systems.

  9. Dynamics of coupled simplest chaotic two-component electronic circuits and its potential application to random bit generation.

    PubMed

    Nguimdo, Romain Modeste; Tchitnga, Robert; Woafo, Paul

    2013-12-01

    We numerically investigate the possibility of using a coupling to increase the complexity in simplest chaotic two-component electronic circuits operating at high frequency. We subsequently show that complex behaviors generated in such coupled systems, together with the post-processing are suitable for generating bit-streams which pass all the NIST tests for randomness. The electronic circuit is built up by unidirectionally coupling three two-component (one active and one passive) oscillators in a ring configuration through resistances. It turns out that, with such a coupling, high chaotic signals can be obtained. By extracting points at fixed interval of 10 ns (corresponding to a bit rate of 100 Mb/s) on such chaotic signals, each point being simultaneously converted in 16-bits (or 8-bits), we find that the binary sequence constructed by including the 10(or 2) least significant bits pass statistical tests of randomness, meaning that bit-streams with random properties can be achieved with an overall bit rate up to 10×100 Mb/s = 1 Gbit/s (or 2×100 Mb/s =200 Megabit/s). Moreover, by varying the bias voltages, we also investigate the parameter range for which more complex signals can be obtained. Besides being simple to implement, the two-component electronic circuit setup is very cheap as compared to optical and electro-optical systems.

  10. Development and Simulation of Increased Generation on a Secondary Circuit of a Microgrid

    NASA Astrophysics Data System (ADS)

    Reyes, Karina

    As fossil fuels are depleted and their environmental impacts remain, other sources of energy must be considered to generate power. Renewable sources, for example, are emerging to play a major role in this regard. In parallel, electric vehicle (EV) charging is evolving as a major load demand. To meet reliability and resiliency goals demanded by the electricity market, interest in microgrids are growing as a distributed energy resource (DER). In this thesis, the effects of intermittent renewable power generation and random EV charging on secondary microgrid circuits are analyzed in the presence of a controllable battery in order to characterize and better understand the dynamics associated with intermittent power production and random load demands in the context of the microgrid paradigm. For two reasons, a secondary circuit on the University of California, Irvine (UCI) Microgrid serves as the case study. First, the secondary circuit (UC-9) is heavily loaded and an integral component of a highly characterized and metered microgrid. Second, a unique "next-generation" distributed energy resource has been deployed at the end of the circuit that integrates photovoltaic power generation, battery storage, and EV charging. In order to analyze this system and evaluate the impact of the DER on the secondary circuit, a model was developed to provide a real-time load flow analysis. The research develops a power management system applicable to similarly integrated systems. The model is verified by metered data obtained from a network of high resolution electric meters and estimated load data for the buildings that have unknown demand. An increase in voltage is observed when the amount of photovoltaic power generation is increased. To mitigate this effect, a constant power factor is set. Should the real power change dramatically, the reactive power is changed to mitigate voltage fluctuations.

  11. Testing of printed circuit board solder joints by optical correlation

    NASA Technical Reports Server (NTRS)

    Espy, P. N.

    1975-01-01

    An optical correlation technique for the nondestructive evaluation of printed circuit board solder joints was evaluated. Reliable indications of induced stress levels in solder joint lead wires are achievable. Definite relations between the inherent strength of a solder joint, with its associated ability to survive stress, are demonstrable.

  12. Automated Test-Form Generation

    ERIC Educational Resources Information Center

    van der Linden, Wim J.; Diao, Qi

    2011-01-01

    In automated test assembly (ATA), the methodology of mixed-integer programming is used to select test items from an item bank to meet the specifications for a desired test form and optimize its measurement accuracy. The same methodology can be used to automate the formatting of the set of selected items into the actual test form. Three different…

  13. Variable cooling circuit for thermoelectric generator and engine and method of control

    DOEpatents

    Prior, Gregory P

    2012-10-30

    An apparatus is provided that includes an engine, an exhaust system, and a thermoelectric generator (TEG) operatively connected to the exhaust system and configured to allow exhaust gas flow therethrough. A first radiator is operatively connected to the engine. An openable and closable engine valve is configured to open to permit coolant to circulate through the engine and the first radiator when coolant temperature is greater than a predetermined minimum coolant temperature. A first and a second valve are controllable to route cooling fluid from the TEG to the engine through coolant passages under a first set of operating conditions to establish a first cooling circuit, and from the TEG to a second radiator through at least some other coolant passages under a second set of operating conditions to establish a second cooling circuit. A method of controlling a cooling circuit is also provided.

  14. Note: Complementary metal-oxide-semiconductor high voltage pulse generation circuits.

    PubMed

    Sun, Jiwei; Wang, Pingshan

    2013-10-01

    We present two types of on-chip pulse generation circuits. The first is based on CMOS pulse-forming-lines (PFLs). It includes a four-stage charge pump, a four-stacked-MOSFET switch and a 5 mm long PFL. The circuit is implemented in a 0.13 μm CMOS process. Pulses of ~1.8 V amplitude with ~135 ps duration on a 50 Ω load are obtained. The obtained voltage is higher than 1.6 V, the rated operating voltage of the process. The second is a high-voltage Marx generator which also uses stacked MOSFETs as high voltage switches. The output voltage is 11.68 V, which is higher than the highest breakdown voltage (~10 V) of the CMOS process. These results significantly extend high-voltage pulse generation capabilities of CMOS technologies.

  15. Generator acceptance test and inspection report

    SciTech Connect

    Johns, B.R.

    1997-07-24

    This Acceptance Test Report(ATR) is the completed testing and inspection of the new portable generator. The testing and inspection is to verify that the generator provided by the vendor meets the requirements of specification WHC-S-0252, Revision 2. Attached is various other documentation to support the inspection and testing.

  16. Generation of spike latency tuning by thalamocortical circuits in auditory cortex.

    PubMed

    Zhou, Yi; Mesik, Lukas; Sun, Yujiao J; Liang, Feixue; Xiao, Zhongju; Tao, Huizhong W; Zhang, Li I

    2012-07-18

    In many sensory systems, the latency of spike responses of individual neurons is found to be tuned for stimulus features and proposed to be used as a coding strategy. Whether the spike latency tuning is simply relayed along sensory ascending pathways or generated by local circuits remains unclear. Here, in vivo whole-cell recordings from rat auditory cortical neurons in layer 4 revealed that the onset latency of their aggregate thalamic input exhibited nearly flat tuning for sound frequency, whereas their spike latency tuning was much sharper with a broadly expanded dynamic range. This suggests that the spike latency tuning is not simply inherited from the thalamus, but can be largely reconstructed by local circuits in the cortex. Dissecting of thalamocortical circuits and neural modeling further revealed that broadly tuned intracortical inhibition prolongs the integration time for spike generation preferentially at off-optimal frequencies, while sharply tuned intracortical excitation shortens it selectively at the optimal frequency. Such push and pull mechanisms mediated likely by feedforward excitatory and inhibitory inputs respectively greatly sharpen the spike latency tuning and expand its dynamic range. The modulation of integration time by thalamocortical-like circuits may represent an efficient strategy for converting information spatially coded in synaptic strength to temporal representation.

  17. A new approach on test generation for array structures using the behavior of the system

    NASA Astrophysics Data System (ADS)

    Molenkamp, Bert

    1987-08-01

    A technique which uses circuit behavior for test generation and reduces the test generation time is described. It is assumed that in an array only one elementary block is faulty at a time and the fault is permanent. No assumption is made about an elementary building block. The circuit does not have to be modelled in a hardware description language, only a prototyping language is necessary for test generation. The technique is suitable for regular slanted array structures, and it seems, compared with other techniques, especially powerful if there are irregularities present, which are often on the border of a regular structure.

  18. Experimental Durability Testing of 4H SiC JFET Integrated Circuit Technology at 727 C

    NASA Technical Reports Server (NTRS)

    Spry, David; Neudeck, Phil; Chen, Liangyu; Chang, Carl; Lukco, Dorothy; Beheim, Glenn M

    2016-01-01

    We have reported SiC integrated circuits (IC's) with two levels of metal interconnect that have demonstrated prolonged operation for thousands of hours at their intended peak ambient operational temperature of 500 C [1, 2]. However, it is recognized that testing of semiconductor microelectronics at temperatures above their designed operating envelope is vital to qualification. Towards this end, we previously reported operation of a 4H-SiC JFET IC ring oscillator on an initial fast thermal ramp test through 727 C [3]. However, this thermal ramp was not ended until a peak temperature of 880 C (well beyond failure) was attained. Further experiments are necessary to better understand failure mechanisms and upper temperature limit of this extreme-temperature capable 4H-SiC IC technology. Here we report on additional experimental testing of custom-packaged 4H-SiC JFET IC devices at temperatures above 500 C. In one test, the temperature was ramped and then held at 727 C, and the devices were periodically measured until electrical failure was observed. A 4H-SiC JFET on this chip electrically functioned with little change for around 25 hours at 727 C before rapid increases in device resistance caused failure. In a second test, devices from our next generation 4H-SiC JFET ICs were ramped up and then held at 700 C (which is below the maximum deposition temperature of the dielectrics). Three ring oscillators functioned for 8 hours at this temperature before degradation. In a third experiment, an alternative die attach of gold paste and package lid was used, and logic circuit operation was demonstrated for 143.5 hours at 700 C.

  19. Initial Testing of the Stainless Steel NaK-Cooled Circuit (SNaKC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne; Godfroy, Thomas

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK) was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around the 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. This presentation addresses the construction, fill and initial testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  20. Item Generation for Test Development [Book Review].

    ERIC Educational Resources Information Center

    Papanastasiou, Elena C.

    2003-01-01

    This volume, based on papers presented at a 1998 conference, collects thinking and research on item generation for test development. It includes materials on psychometric and cognitive theory, construct-oriented approaches to item generation, the item generation process, and some applications of item generative principles. (SLD)

  1. Design and test of clock distribution circuits for the Macro Pixel ASIC

    NASA Astrophysics Data System (ADS)

    Gaioni, L.; De Canio, F.; Manghisoni, M.; Ratti, L.; Re, V.; Traversi, G.

    2016-07-01

    Clock distribution circuits account for a significant fraction of the power dissipation of the Macro Pixel ASIC (MPA), designed for the pixel layer readout of the so-called Pixel-Strip module in the innermost part of the CMS tracker at the High Luminosity LHC. A test chip including low power clock distribution circuits of the MPA has been designed in a 65 nm CMOS technology and thoroughly tested. This work summarizes the experimental results relevant to the prototype chip, focusing particularly on the power and speed performance and compares such results with those coming from circuit simulations.

  2. A miniature microcontroller curve tracing circuit for space flight testing transistors.

    PubMed

    Prokop, N; Greer, L; Krasowski, M; Flatico, J; Spina, D

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results.

  3. Architectures and Design for Next-Generation Hybrid Circuit/Packet Networks

    NASA Astrophysics Data System (ADS)

    Vadrevu, Sree Krishna Chaitanya

    Internet traffic is increasing rapidly at an annual growth rate of 35% with aggregate traffic exceeding several Exabyte's per month. The traffic is also becoming heterogeneous in bandwidth and quality-of-service (QoS) requirements with growing popularity of cloud computing, video-on-demand (VoD), e-science, etc. Hybrid circuit/packet networks which can jointly support circuit and packet services along with the adoption of high-bit-rate transmission systems form an attractive solution to address the traffic growth. 10 Gbps and 40 Gbps transmission systems are widely deployed in telecom backbone networks such as Comcast, AT&T, etc., and network operators are considering migration to 100 Gbps and beyond. This dissertation proposes robust architectures, capacity migration strategies, and novel service frameworks for next-generation hybrid circuit/packet architectures. In this dissertation, we study two types of hybrid circuit/packet networks: a) IP-over-WDM networks, in which the packet (IP) network is overlaid on top of the circuit (optical WDM) network and b) Hybrid networks in which the circuit and packet networks are deployed side by side such as US DoE's ESnet. We investigate techniques to dynamically migrate capacity between the circuit and packet sections by exploiting traffic variations over a day, and our methods show that significant bandwidth savings can be obtained with improved reliability of services. Specifically, we investigate how idle backup circuit capacity can be used to support packet services in IP-over-WDM networks, and similarly, excess capacity in packet network to support circuit services in ESnet. Control schemes that enable our mechanisms are also discussed. In IP-over-WDM networks, with upcoming 100 Gbps and beyond, dedicated protection will induce significant under-utilization of backup resources. We investigate design strategies to loan idle circuit backup capacity to support IP/packet services. However, failure of backup circuits will

  4. Method of boundary testing of the electric circuits and its application for calculating electric tolerances. [electric equipment tests

    NASA Technical Reports Server (NTRS)

    Redkina, N. P.

    1974-01-01

    Boundary testing of electric circuits includes preliminary and limiting tests. Preliminary tests permit determination of the critical parameters causing the greatest deviation of the output parameter of the system. The boundary tests offer the possibility of determining the limits of the fitness of the system with simultaneous variation of its critical parameters.

  5. A Novel Picosecond Pulse Generation Circuit Based on SRD and NLTL

    PubMed Central

    Zhou, Jianming; Lu, Qiuyuan; Liu, Fan; Li, Yinqiao

    2016-01-01

    Because of the importance of ultra-wideband (UWB) radar in various applications, short pulse generation in UWB systems has attracted a lot of attention in recent years. In order to shorten the pulse, nonlinear transmission line (NLTL) is imported, which expands the application of step recovery diode (SRD) for pulse generation. Detailed analysis and equations for this SRD and NLTL-based pulse generation are provided and verified by simulation and experimental results. Factors that could cause pulse waveform distortions are also analyzed. The generator circuit presented in this paper generates 130ps and 3.3V pulse, which can be used in UWB radar systems that require sub-nanosecond pulses. PMID:26919290

  6. F-1 Engine Gas Generator Testing

    NASA Video Gallery

    The gas generator from an F-1 engine is test-fired at the Marshall Space Flight Center in Huntsville, Ala., on Jan. 24, 2013. Data from the 30 second test will be used in the development of advance...

  7. Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Blaes, Brent R. (Inventor); Nixon, Robert H. (Inventor); Soli, George A. (Inventor)

    1995-01-01

    A method for predicting the SEU susceptibility of a standard-cell D-latch using an alpha-particle sensitive SRAM, SPICE critical charge simulation results, and alpha-particle interaction physics. A technique utilizing test structures to quickly and inexpensively characterize the SEU sensitivity of standard cell latches intended for use in a space environment. This bench-level approach utilizes alpha particles to induce upsets in a low LET sensitive 4-k bit test SRAM. This SRAM consists of cells that employ an offset voltage to adjust their upset sensitivity and an enlarged sensitive drain junction to enhance the cell's upset rate.

  8. Development of a Novel Test Method for On-Demand Internal Short Circuit in a Li-Ion Cell (Presentation)

    SciTech Connect

    Keyser, M.; Long, D.; Jung, Y. S.; Pesaran, A.; Darcy, E.; McCarthy, B.; Patrick, L.; Kruger, C.

    2011-01-01

    This presentation describes a cell-level test method that simulates an emergent internal short circuit, produces consistent and reproducible test results, can establish the locations and temperatures/power/SOC conditions where an internal short circuit will result in thermal runaway, and provides relevant data to validate internal short circuit models.

  9. Design and testing of an active quenching circuit for an avalanche photodiode photon detector

    NASA Technical Reports Server (NTRS)

    Arbel, D.; Schwartz, J. A.

    1991-01-01

    The photon-detection capabilities of avalanche photodiodes (APDs) operating above their theoretical breakdown voltages are described, with particular attention given to the needs and methods of quenching an avalanche once breakdown has occurred. A brief background on the motives of and previous work with this mode of operation is presented. Finally, a description of the design and testing of an active quenching circuit is given. Although the active quenching circuit did not perform as expected, knowledge was gained as to the signal amplitudes necessary for quenching and the need for a better model for the above-breakdown circuit characteristics of the Geiger-mode APD.

  10. Addressable Inverter Matrix Tests Integrated-Circuit Wafer

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.

    1988-01-01

    Addressing elements indirectly through shift register reduces number of test probes. With aid of new technique, complex test structure on silicon wafer tested with relatively small number of test probes. Conserves silicon area by reduction of area devoted to pads. Allows thorough evaluation of test structure characteristics and of manufacturing process parameters. Test structure consists of shift register and matrix of inverter/transmission-gate cells connected to two-by-ten array of probe pads. Entire pattern contained in square area having only 1.6-millimeter sides. Shift register is conventional static CMOS device using inverters and transmission gates in master/slave D flip-flop configuration.

  11. Revised evaluation of steam generator testing alternatives

    SciTech Connect

    1981-01-01

    A scoping evaluation was made of various facility alternatives for test of LMFBR prototype steam generators and models. Recommendations are given for modifications to EBR-II and SCTI (Sodium Components Test Installation) for prototype SG testing, and for few-tube model testing. (DLC)

  12. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED.

    PubMed

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-01-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit. PMID:27562055

  13. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED

    PubMed Central

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-01-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit. PMID:27562055

  14. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED

    NASA Astrophysics Data System (ADS)

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-08-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit.

  15. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1992-01-01

    A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Temperature definition and vibration tests are performed next. Final assembly testing is performed to simulate the Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation. Verification is successful when all components and final assemblies have passed each test. This method was very successful in verifying that commercial printed-circuit boards will survive in the Shuttle environment.

  16. Photonic integrated circuit for all-optical millimeter-wave signal generation

    SciTech Connect

    Vawter, G.A.; Mar, A.; Zolper, J.; Hietala, V.

    1997-03-01

    Generation of millimeter-wave electronic signals and power is required for high-frequency communication links, RADAR, remote sensing and other applications. However, in the 30 to 300 GHz mm-wave regime, signal sources are bulky and inefficient. All-optical generation of mm-wave signals promises to improve efficiency to as much as 30 to 50 percent with output power as high as 100 mW. All of this may be achieved while taking advantage of the benefits of monolithic integration to reduce the overall size to that of a single semiconductor chip only a fraction of a square centimeter in size. This report summarizes the development of the first monolithically integrated all-optical mm-wave signal generator ever built. The design integrates a mode-locked semiconductor ring diode laser with an optical amplifier and high-speed photodetector into a single optical integrated circuit. Frequency generation is demonstrated at 30, 60 and 90 Ghz.

  17. Modifications to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIp, provided by Idaho National Laboratory (INL), is the subject of the first round ofexperimentation. This paper provides a summary of the tests conducted on the original circuit, details the physical changes that have since been made to it, and describes the current test program.

  18. A hybrid electrical/chemical circuit in the spinal cord generates a transient embryonic motor behavior.

    PubMed

    Knogler, Laura D; Ryan, Joel; Saint-Amant, Louis; Drapeau, Pierre

    2014-07-16

    Spontaneous network activity is a highly stereotyped early feature of developing circuits throughout the nervous system, including in the spinal cord. Spinal locomotor circuits produce a series of behaviors during development before locomotion that reflect the continual integration of spinal neurons into a functional network, but how the circuitry is reconfigured is not understood. The first behavior of the zebrafish embryo (spontaneous coiling) is mediated by an electrical circuit that subsequently generates mature locomotion (swimming) as chemical neurotransmission develops. We describe here a new spontaneous behavior, double coiling, that consists of two alternating contractions of the tail in rapid succession. Double coiling was glutamate-dependent and required descending hindbrain excitation, similar to but preceding swimming, making it a discrete intermediary developmental behavior. At the cellular level, motoneurons had a distinctive glutamate-dependent activity pattern that correlated with double coiling. Two glutamatergic interneurons, CoPAs and CiDs, had different activity profiles during this novel behavior. CoPA neurons failed to show changes in activity patterns during the period in which double coiling appears, whereas CiD neurons developed a glutamate-dependent activity pattern that correlated with double coiling and they innervated motoneurons at that time. Additionally, double coils were modified after pharmacological reduction of glycinergic neurotransmission such that embryos produced three or more rapidly alternating coils. We propose that double coiling behavior represents an important transition of the motor network from an electrically coupled spinal cord circuit that produces simple periodic coils to a spinal network driven by descending chemical neurotransmission, which generates more complex behaviors.

  19. Analysis of Distribution Circuits with High Penetrations of Photo-Voltaic Generation and Progressive Steps to Enable Higher Penetrations

    NASA Astrophysics Data System (ADS)

    Payne, Joshua Daniel

    Concern for anthropogenic climate change has instigated an increase in renewable generation capacity, including photo-voltaic (PV) power generation in distribution circuits. Distribution circuits with relatively high penetrations of PV generation (High-Pen PV) exist today, but how much more generation can distribution systems handle? This research aims to approach this question by 1) analyzing and quantifying High-Pen PV limitations on the primary circuits of distribution systems and 2) propose and analyze progressive steps to enable higher penetrations of PV on distribution circuits. Utilizing connectivity and load demand measurements provided by Pacific Gas & Electric (PG&E), time-resolved three-phase balanced feeder models of a commercial and a residential circuit featuring High-Pen PV were developed and calibrated to the point of the sub-station. Once calibrated, the circuit performance was simulated with varying PV penetrations and spatial distributions for typical seasonal high and seasonal low load demand days. Circuit scenarios with the Generation Center located downstream of the Load Center and with high impedance distribution line in-between lead to high voltage conditions. High-Pen PV interacting with the sub-station Load Drop Compensation (LDC) resulted an increased number of equipment operations and low voltage conditions on the circuit. As PV penetration increased, sub-station power factor and line loss decreased until reverse power flow became dominant. These were observed characteristics of High-Pen PV circuits. To overcome the limitations stated above, practical steps, such as line re-conductoring, and progressive control and operation changes were introduced. The progressive changes included using a Voltage Rise Siting (VRS) score for planning and LDC Current Compensation control to enable higher penetrations of PV. It was shown that limitations of High-Pen PV on the primary side of distribution circuits may be overcome via these practical and

  20. The high current transient generator, theory and operation for simulating lightning induced voltages into aerospace electrical circuits

    NASA Technical Reports Server (NTRS)

    Schulte, E. H.

    1975-01-01

    Because of the difficulty, hazard, and cost of simulating full-scale lightning currents on flight vehicles, a nondestructive test technique using reduced-scale lightning currents was used to determine if threat level voltages will be induced into aircraft electrical circuits in the event the aircraft is actually struck by lightning. The reasoning and theory of selecting a particular simulated lightning waveshape and magnitude is given, showing that extrapolation of induced waveforms over several orders of magnitude should be avoided. The operation of high-current transient generators and hardware are described along with typical applications. The means by which voltages were generated, induced, and measured, as well as possible sources of error, are discussed.

  1. Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

    NASA Technical Reports Server (NTRS)

    Garber, A.; Godfroy, T.; Webster, K.

    2007-01-01

    Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  2. 4H-SiC JFET Multilayer Integrated Circuit Technologies Tested Up to 1000 K

    NASA Technical Reports Server (NTRS)

    Spry, D. J.; Neudeck, P. G.; Chen, L.; Chang, C. W.; Lukco, D.; Beheim, G. M.

    2015-01-01

    Testing of semiconductor electronics at temperatures above their designed operating envelope is recognized as vital to qualification and lifetime prediction of circuits. This work describes the high temperature electrical testing of prototype 4H silicon carbide (SiC) junction field effect transistor (JFET) integrated circuits (ICs) technology implemented with multilayer interconnects; these ICs are intended for prolonged operation at temperatures up to 773K (500 C). A 50 mm diameter sapphire wafer was used in place of the standard NASA packaging for this experiment. Testing was carried out between 300K (27 C) and 1150K (877 C) with successful electrical operation of all devices observed up to 1000K (727 C).

  3. Generating Test Templates via Automated Theorem Proving

    NASA Technical Reports Server (NTRS)

    Kancherla, Mani Prasad

    1997-01-01

    Testing can be used during the software development process to maintain fidelity between evolving specifications, program designs, and code implementations. We use a form of specification-based testing that employs the use of an automated theorem prover to generate test templates. A similar approach was developed using a model checker on state-intensive systems. This method applies to systems with functional rather than state-based behaviors. This approach allows for the use of incomplete specifications to aid in generation of tests for potential failure cases. We illustrate the technique on the cannonical triangle testing problem and discuss its use on analysis of a spacecraft scheduling system.

  4. Photonic integrated circuit on InP for millimeter wave generation

    NASA Astrophysics Data System (ADS)

    van Dijk, Frederic; Lamponi, Marco; Chtioui, Mourad; Lelarge, François; Kervella, Gaël.; Rouvalis, Efthymios; Renaud, Cyril; Fice, Martyn; Carpintero, Guillermo

    2014-03-01

    Indium phosphide and associated epitaxially grown alloys is a material system of choice to make photonic integrated circuits for microwave to terahertz signal generation, processing and detection. Fabrication of laser emitters, high speed electro-optical modulators, passive waveguides and couplers, optical filters and high speed photodetectors is well mastered for discrete devices. But monolithic integration of them while maintaining good performances is a big challenge. We have demonstrated a fully integrated tunable heterodyne source designed for the generation and modulation of sub-Terahertz signals. This device is to be used for high data-rate wireless transmissions. DFB lasers, SOA amplifiers, passive waveguides, beam combiners, electro-optic modulators and high speed photodetectors have been integrated on the same InP-based platform. Millimeter wave generation at up to 120 GHz based on heterodyning the optical tones from two integrated lasers in an also integrated high bandwidth photodetector has been obtained.

  5. Continuous generation and stabilization of Schrödinger cat states in a quantum circuit

    NASA Astrophysics Data System (ADS)

    Roy, A.; Leghtas, Z.; Stone, A. D.; Devoret, M. H.; Mirrahimi, M.

    2015-03-01

    While dissipation is widely considered as being harmful for quantum coherence, it can, when properly engineered, lead to the stabilization of non-trivial pure quantum states. Deterministic generation of non-classical states like Schrödinger cat states is one of the key ingredients in performing universal quantum computation. We theoretically propose a scheme, adapted to superconducting quantum circuits, for continuous generation and stabilization of these states in a cavity using dissipation engineering. We first generate these states inside a high-Q cavity by engineering its dissipation with a bath that only exchanges photons in pairs. We then stabilize these transient states against single-photon decay using a second engineered bath. The single-photon stabilization is autonomous, and exploits the photon-number-dependent frequency-splitting due to Kerr interactions in the strongly dispersive regime of circuit QED. We present analytical and numerical results demonstrating the robustness of the scheme and its amenability to immediate experimental implementation. Work supported by ARO.

  6. Description and test results of a variable speed, constant frequency generating system

    NASA Technical Reports Server (NTRS)

    Brady, F. J.

    1985-01-01

    The variable-speed, constant frequency generating system developed for the Mod-0 wind turbine is presented. This report describes the system as it existed at the conclusion of the project. The cycloconverter control circuit is described including the addition of field-oriented control. The laboratory test and actual wind turbine test results are included.

  7. Mechanisms of left-right coordination in mammalian locomotor pattern generation circuits: a mathematical modeling view.

    PubMed

    Molkov, Yaroslav I; Bacak, Bartholomew J; Talpalar, Adolfo E; Rybak, Ilya A

    2015-05-01

    The locomotor gait in limbed animals is defined by the left-right leg coordination and locomotor speed. Coordination between left and right neural activities in the spinal cord controlling left and right legs is provided by commissural interneurons (CINs). Several CIN types have been genetically identified, including the excitatory V3 and excitatory and inhibitory V0 types. Recent studies demonstrated that genetic elimination of all V0 CINs caused switching from a normal left-right alternating activity to a left-right synchronized "hopping" pattern. Furthermore, ablation of only the inhibitory V0 CINs (V0D subtype) resulted in a lack of left-right alternation at low locomotor frequencies and retaining this alternation at high frequencies, whereas selective ablation of the excitatory V0 neurons (V0V subtype) maintained the left-right alternation at low frequencies and switched to a hopping pattern at high frequencies. To analyze these findings, we developed a simplified mathematical model of neural circuits consisting of four pacemaker neurons representing left and right, flexor and extensor rhythm-generating centers interacting via commissural pathways representing V3, V0D, and V0V CINs. The locomotor frequency was controlled by a parameter defining the excitation of neurons and commissural pathways mimicking the effects of N-methyl-D-aspartate on locomotor frequency in isolated rodent spinal cord preparations. The model demonstrated a typical left-right alternating pattern under control conditions, switching to a hopping activity at any frequency after removing both V0 connections, a synchronized pattern at low frequencies with alternation at high frequencies after removing only V0D connections, and an alternating pattern at low frequencies with hopping at high frequencies after removing only V0V connections. We used bifurcation theory and fast-slow decomposition methods to analyze network behavior in the above regimes and transitions between them. The model

  8. Development of a Three-Tier Test to Assess Misconceptions about Simple Electric Circuits

    ERIC Educational Resources Information Center

    Pesman, Haki; Eryilmaz, Ali

    2010-01-01

    The authors aimed to propose a valid and reliable diagnostic instrument by developing a three-tier test on simple electric circuits. Based on findings from the interviews, open-ended questions, and the related literature, the test was developed and administered to 124 high school students. In addition to some qualitative techniques for…

  9. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  10. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  11. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  12. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  13. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus...

  14. Test Generators: Teacher's Tool or Teacher's Headache?

    ERIC Educational Resources Information Center

    Eiser, Leslie

    1988-01-01

    Discusses the advantages and disadvantages of test generation programs. Includes setting up, printing exams and "bells and whistles." Reviews eight computer packages for Apple and IBM personal computers. Compares features, costs, and usage. (CW)

  15. Test-Signal Generator For SNR Calibration

    NASA Technical Reports Server (NTRS)

    Gutierrez-Luaces, Benito O.

    1993-01-01

    Assembly of commercial and custom-made electronic equipment designed to generate noisy intermediate-frequency or baseband received phase-modulation data-communication signals with accurately known signal-to-noise ratios. Signals used to perform signal-to-noise-ratio calibrations and other tests of responses of data-communication receivers to noisy incoming signals. Underlying principle applicable to generation of test signals for other advanced data-communication receivers.

  16. Integration of MHD load models with circuit representations the Z generator.

    SciTech Connect

    Jennings, Christopher A.; Ampleford, David J.; Jones, Brent Manley; McBride, Ryan D.; Bailey, James E.; Jones, Michael C.; Gomez, Matthew Robert.; Cuneo, Michael Edward; Nakhleh, Charles; Stygar, William A.; Savage, Mark Edward; Wagoner, Timothy C.; Moore, James K.

    2013-03-01

    MHD models of imploding loads fielded on the Z accelerator are typically driven by reduced or simplified circuit representations of the generator. The performance of many of the imploding loads is critically dependent on the current and power delivered to them, so may be strongly influenced by the generators response to their implosion. Current losses diagnosed in the transmission lines approaching the load are further known to limit the energy delivery, while exhibiting some load dependence. Through comparing the convolute performance of a wide variety of short pulse Z loads we parameterize a convolute loss resistance applicable between different experiments. We incorporate this, and other current loss terms into a transmission line representation of the Z vacuum section. We then apply this model to study the current delivery to a wide variety of wire array and MagLif style liner loads.

  17. MYSID TWO-GENERATION TEST GUIDELINE

    EPA Science Inventory

    McKenney, Charles L., Jr. In press. Mysid Two-Generation Test Guideline. OECD Expert Group on Invertebrate Testing for Endocrine Disruptors, Organisation for Economic Co-operation and Development, Paris, France. 17 p. (ERL,GB 1215).

    This guideline describes a two-generati...

  18. Assessing the SEU resistance of CMOS latches using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M.; Blaes, B.; Nixon, R.

    1990-01-01

    The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environment is evident in the upset rate of the Tracking and Data Relay Satellite (TDRS) launched in Apr. 1983. This satellite experiences a single-event-upset (SEU) per day which must be corrected from the ground. Such experience caused a redesign of the Galileo spacecraft with SEU resistant IC's. The solution to the SEU problem continues to be important as the complexity of spacecraft grows, the feature size of IC's decreases, and as space systems are designed with circuits fabricated at non-radiation hardened foundries. This paper describes an approach for verifying the susceptibility of CMOS latches to heavy-ion induced state changes. The approach utilizes alpha particles to induce the upsets in test circuits. These test circuits are standard cells that have offset voltages which sensitize the circuits to upsets. These results are then used to calculate the upsetability at operating voltages. In this study results are presented for the alpha particle upset of a six-transistor static random access memory (SRAM) cell. Then a methodology is described for the analysis of a standard-cell inverter latch.

  19. Testing of Diode-Clamping in an Inductive Pulsed Plasma Thruster Circuit

    NASA Technical Reports Server (NTRS)

    Toftul, Alexandra; Polzin, Kurt A.; Martin, Adam K.; Hudgins, Jerry L.

    2014-01-01

    Testing of a 5.5 kV silicon (Si) diode and 5.8 kV prototype silicon carbide (SiC) diode in an inductive pulsed plasma thruster (IPPT) circuit was performed to obtain a comparison of the resulting circuit recapture efficiency,eta(sub r), defined as the percentage of the initial charge energy remaining on the capacitor bank after the diode interrupts the current. The diode was placed in a pulsed circuit in series with a silicon controlled rectifier (SCR) switch, and the voltages across different components and current waveforms were collected over a range of capacitor charge voltages. Reverse recovery parameters, including turn-off time and peak reverse recovery current, were measured and capacitor voltage waveforms were used to determine the recapture efficiency for each case. The Si fast recovery diode in the circuit was shown to yield a recapture efficiency of up to 20% for the conditions tested, while the SiC diode further increased recapture efficiency to nearly 30%. The data presented show that fast recovery diodes operate on a timescale that permits them to clamp the discharge quickly after the first half cycle, supporting the idea that diode-clamping in IPPT circuit reduces energy dissipation that occurs after the first half cycle

  20. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1991-01-01

    A method is discussed developed to verify commercial printed-circuit boards for a shuttle orbital flight. The Space Acceleration Measurement System Project used this method first with great success. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Then temperature definition tests are performed that consist of infrared scanning, thermal vacuum testing, and preliminary thermal operational testing. Only the engineering unit is used for temperature definition testing, but the preliminary thermal operational testing is performed on the flight unit after the temperature range has been defined. In the sequence of testing, vibration testing is performed next, but most vibration failures cannot be detected without subsequent temperature cycling. Finally, final assembly testing is performed to simulate the shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 hours of trouble-free operation. Verification is successful when all components and final assemblies have passed each test satisfactory. This method was very successful in verifying that commercial printed-circuit boards will survive in the shuttle environment.

  1. Formal methods for test case generation

    NASA Technical Reports Server (NTRS)

    Rushby, John (Inventor); De Moura, Leonardo Mendonga (Inventor); Hamon, Gregoire (Inventor)

    2011-01-01

    The invention relates to the use of model checkers to generate efficient test sets for hardware and software systems. The method provides for extending existing tests to reach new coverage targets; searching *to* some or all of the uncovered targets in parallel; searching in parallel *from* some or all of the states reached in previous tests; and slicing the model relative to the current set of coverage targets. The invention provides efficient test case generation and test set formation. Deep regions of the state space can be reached within allotted time and memory. The approach has been applied to use of the model checkers of SRI's SAL system and to model-based designs developed in Stateflow. Stateflow models achieving complete state and transition coverage in a single test case are reported.

  2. New reconstruction method for x-ray testing of multilayer printed circuit board

    NASA Astrophysics Data System (ADS)

    Yang, Min; Wang, Gao; Liu, Yongzhan

    2010-05-01

    For multilayer printed circuit board (PCB) and large-scale integrated circuit (LIC) chips, nondestructive testing of the inner structure and welding defects is very important for circuit diagram reverse design and manufacturing quality control. The traditional nondestructive testing of this kind of plate-like object is digital radiography (DR), which can provide only images with overlapped information, so it is difficult to get a full and accurate circuit image of every layer and the position of the defects using the DR method. At the same time, traditional computed tomography scanning methods are also unable to resolve this problem. A new reconstruction method is proposed for the nondestructive testing of plate-like objects. With this method, x rays irradiate the surface of the reconstructed object at an oblique angle, and a series of projection images are obtained while the object is rotating. Then, through a relevant preprocessing method on the projections and a special reconstructing algorithm, cross sections of the scanning region are finally obtained slice by slice. The experimental results prove that this method satisfactorily addresses the challenges of nondestructive testing of plate-like objects such as PCB or LIC.

  3. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Gas flow test; closed-circuit apparatus. 84.94 Section 84.94 Public Health PUBLIC HEALTH SERVICE, DEPARTMENT OF HEALTH AND HUMAN SERVICES OCCUPATIONAL SAFETY AND HEALTH RESEARCH AND RELATED ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.94 Gas flow...

  4. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Gas flow test; open-circuit apparatus. 84.93 Section 84.93 Public Health PUBLIC HEALTH SERVICE, DEPARTMENT OF HEALTH AND HUMAN SERVICES OCCUPATIONAL SAFETY AND HEALTH RESEARCH AND RELATED ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.93 Gas flow...

  5. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Testing, examination, and maintenance of circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Underground High-Voltage Distribution §...

  6. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Testing, examination, and maintenance of circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL...

  7. Development of a stereo-symmetrical nanosecond pulsed power generator composed of modularized avalanche transistor Marx circuits

    NASA Astrophysics Data System (ADS)

    Li, Jiang-Tao; Zhong, Xu; Cao, Hui; Zhao, Zheng; Xue, Jing; Li, Tao; Li, Zheng; Wang, Ya-Nan

    2015-09-01

    Avalanche transistors have been widely studied and used in nanosecond high voltage pulse generations. However, output power improvement is always limited by the low thermal capacities of avalanche transistors, especially under high repetitive working frequency. Parallel stacked transistors can effectively improve the output current but the controlling of trigger and output synchronism has always been a hard and complex work. In this paper, a novel stereo-symmetrical nanosecond pulsed power generator with high reliability was developed. By analyzing and testing the special performances of the combined Marx circuits, numbers of meaningful conclusions on the pulse amplitude, pulse back edge, and output impedance were drawn. The combining synchronism of the generator was confirmed excellent and lower conducting current through the transistors was realized. Experimental results showed that, on a 50 Ω resistive load, pulses with 1.5-5.2 kV amplitude and 5.3-14.0 ns width could be flexibly generated by adjusting the number of combined modules, the supply voltage, and the module type.

  8. Short circuit testing of a nickel-hydrogen cell for compliance with range safety requirements

    SciTech Connect

    Tracinski, W.A.; Applewhite, A.Z.

    1997-12-01

    Short circuit testing was performed on a single stack, Independent Pressure Vessel (IPV) aerospace Nickel-Hydrogen cell with axial terminals for compliance with range safety requirements. The cell contained two brazed ceramic seals, was 3 1/2 inches in diameter, and had a nameplate rating of 85.5 Ah. The majority of the energy was released in the first ten minutes with peak terminal temperature reaching 192 degrees Celsius. No breaching of the cell was evident and the cell returned to normal open circuit voltage within fifteen minutes of the load being removed.

  9. A miniature microcontroller curve tracing circuit for space flight testing transistors.

    PubMed

    Prokop, N; Greer, L; Krasowski, M; Flatico, J; Spina, D

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results. PMID:25725870

  10. Molten-Caustic-Leaching (Gravimelt) System Integration Project, Phase 2. Topical report for test circuit operation

    SciTech Connect

    Not Available

    1993-02-01

    The objective of the task (Task 6) covered in this document was to operate the refurbished/modified test circuit of the Gravimeh Process in a continuous integrated manner to obtain the engineering and operational data necessary to assess the technical performance and reliability of the circuit. This data is critical to the development of this technology as a feasible means of producing premium clean burning fuels that meet New Source Performance Standards (NSPS). Significant refurbishments and design modifications had been made to the facility (in particular to the vacuum filtration and evaporation units) during Tasks 1 and 2, followed by off-line testing (Task 3). Two weeks of continuous around-the-clock operation of the refurbished/modified MCL test circuit were performed. During the second week of testing, all sections of the plant were operated in an integrated fashion for an extended period of time, including a substantial number of hours of on-stream time for the vacuum filters and the caustic evaporation unit. A new process configuration was tested in which centrate from the acid wash train (without acid addition) was used as the water makeup for the water wash train, thus-eliminating the one remaining process waste water stream. A 9-inch centrifuge was tested at various solids loadings and at flow rates up to 400 lbs/hr of coal feed to obtain a twenty-fold scaleup factor over the MCL integrated test facility centrifuge performance data.

  11. Recent Updates to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIP, provided by Idaho National Laboratory (1NL), is the subject of the first round of experimentation. This presentation details the physical changes made to the FSP-PTC and the current test program.

  12. Controllable high-fidelity quantum state transfer and entanglement generation in circuit QED.

    PubMed

    Xu, Peng; Yang, Xu-Chen; Mei, Feng; Xue, Zheng-Yuan

    2016-01-25

    We propose a scheme to realize controllable quantum state transfer and entanglement generation among transmon qubits in the typical circuit QED setup based on adiabatic passage. Through designing the time-dependent driven pulses applied on the transmon qubits, we find that fast quantum sate transfer can be achieved between arbitrary two qubits and quantum entanglement among the qubits also can also be engineered. Furthermore, we numerically analyzed the influence of the decoherence on our scheme with the current experimental accessible systematical parameters. The result shows that our scheme is very robust against both the cavity decay and qubit relaxation, the fidelities of the state transfer and entanglement preparation process could be very high. In addition, our scheme is also shown to be insensitive to the inhomogeneous of qubit-resonator coupling strengths.

  13. Controllable high-fidelity quantum state transfer and entanglement generation in circuit QED

    PubMed Central

    Xu, Peng; Yang, Xu-Chen; Mei, Feng; Xue, Zheng-Yuan

    2016-01-01

    We propose a scheme to realize controllable quantum state transfer and entanglement generation among transmon qubits in the typical circuit QED setup based on adiabatic passage. Through designing the time-dependent driven pulses applied on the transmon qubits, we find that fast quantum sate transfer can be achieved between arbitrary two qubits and quantum entanglement among the qubits also can also be engineered. Furthermore, we numerically analyzed the influence of the decoherence on our scheme with the current experimental accessible systematical parameters. The result shows that our scheme is very robust against both the cavity decay and qubit relaxation, the fidelities of the state transfer and entanglement preparation process could be very high. In addition, our scheme is also shown to be insensitive to the inhomogeneous of qubit-resonator coupling strengths. PMID:26804326

  14. Microbiota-generated metabolites promote metabolic benefits via gut-brain neural circuits.

    PubMed

    De Vadder, Filipe; Kovatcheva-Datchary, Petia; Goncalves, Daisy; Vinera, Jennifer; Zitoun, Carine; Duchampt, Adeline; Bäckhed, Fredrik; Mithieux, Gilles

    2014-01-16

    Soluble dietary fibers promote metabolic benefits on body weight and glucose control, but underlying mechanisms are poorly understood. Recent evidence indicates that intestinal gluconeogenesis (IGN) has beneficial effects on glucose and energy homeostasis. Here, we show that the short-chain fatty acids (SCFAs) propionate and butyrate, which are generated by fermentation of soluble fiber by the gut microbiota, activate IGN via complementary mechanisms. Butyrate activates IGN gene expression through a cAMP-dependent mechanism, while propionate, itself a substrate of IGN, activates IGN gene expression via a gut-brain neural circuit involving the fatty acid receptor FFAR3. The metabolic benefits on body weight and glucose control induced by SCFAs or dietary fiber in normal mice are absent in mice deficient for IGN, despite similar modifications in gut microbiota composition. Thus, the regulation of IGN is necessary for the metabolic benefits associated with SCFAs and soluble fiber.

  15. Design of parity generator and checker circuit using electro-optic effect of Mach-Zehnder interferometers

    NASA Astrophysics Data System (ADS)

    Kumar, Santosh; Chanderkanta; Amphawan, Angela

    2016-04-01

    Parity is an extra bit which is used to add in digital information to detect error at the receiver end. It can be even and odd parity. In case of even parity, the number of one's will be even included the parity and reverse in the case of odd parity. The circuit which is used to generate the parity at the transmitter side, called the parity generator and the circuit which is used to detect the parity at receiver side is called as parity checker. In this paper, an even and odd parity generator and checker circuits are designed using electro-optic effect inside lithium niobate based Mach-Zehnder Interferometers (MZIs). The MZIs structures collectively show powerful capability in switching an input optical signal to a desired output port from a collection of output ports. The paper constitutes a mathematical description of the proposed device and thereafter simulation using MATLAB. The study is verified using beam propagation method (BPM).

  16. Continuous generation and stabilization of mesoscopic field superposition states in a quantum circuit

    NASA Astrophysics Data System (ADS)

    Roy, Ananda; Leghtas, Zaki; Stone, A. Douglas; Devoret, Michel; Mirrahimi, Mazyar

    2015-01-01

    While dissipation is widely considered to be harmful for quantum coherence, it can, when properly engineered, lead to the stabilization of nontrivial pure quantum states. We propose a scheme for continuous generation and stabilization of Schrödinger cat states in a cavity using dissipation engineering. We first generate nonclassical photon states with definite parity by means of a two-photon drive and dissipation, and then stabilize these transient states against single-photon decay. The single-photon stabilization is autonomous, and is implemented through a second engineered bath, which exploits the photon-number-dependent frequency splitting due to Kerr interactions in the strongly dispersive regime of circuit QED. Starting with the Hamiltonian of the baths plus cavity, we derive an effective model of only the cavity photon states along with analytic expressions for relevant physical quantities, such as the stabilization rate. The deterministic generation of such cat states is one of the key ingredients in performing universal quantum computation.

  17. Next Generation Drivetrain Development and Test Program

    SciTech Connect

    Keller, Jonathan; Erdman, Bill; Blodgett, Doug; Halse, Chris; Grider, Dave

    2015-11-03

    This presentation was given at the Wind Energy IQ conference in Bremen, Germany, November 30 through December 2, 2105. It focused on the next-generation drivetrain architecture and drivetrain technology development and testing (including gearbox and inverter software and medium-voltage inverter modules.

  18. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

  19. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, J. A., Jr.

    1998-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional (3-D) electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

  20. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1998-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional (3-D) electromagnetic computer code, MAxwell's equations by the Finite Integration Algorithm (MAFIA). Cold-test parameters have been calculated for several helical traveLing-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making It possible, for the first time, to design complete TWT via computer simulation.

  1. ADDER CIRCUIT

    DOEpatents

    Jacobsohn, D.H.; Merrill, L.C.

    1959-01-20

    An improved parallel addition unit is described which is especially adapted for use in electronic digital computers and characterized by propagation of the carry signal through each of a plurality of denominationally ordered stages within a minimum time interval. In its broadest aspects, the invention incorporates a fast multistage parallel digital adder including a plurality of adder circuits, carry-propagation circuit means in all but the most significant digit stage, means for conditioning each carry-propagation circuit during the time period in which information is placed into the adder circuits, and means coupling carry-generation portions of thc adder circuit to the carry propagating means.

  2. Surface Degradation of Ag/W Circuit Breaker Contacts During Standardized UL Testing

    NASA Astrophysics Data System (ADS)

    Yu, Haibo; Sun, Yu; Kesim, M. Tumerkan; Harmon, Jason; Potter, Jonathan; Alpay, S. Pamir; Aindow, Mark

    2015-09-01

    The near-surface microstructure of Ag/W contacts from 120 V, 30 A commercial circuit breakers in the as-manufactured condition and after standardized UL overload/temperature-rise, endurance, and short-circuit testing have been investigated using a combination of x-ray diffraction, scanning electron microscopy, energy-dispersive x-ray spectroscopy, focused ion beam milling, and transmission electron microscopy. The as-manufactured contacts comprised three constituents: sintered Ag/W composite particles with fine-grained Ag and coarse-grained W, coarse-grained pockets of Ag infiltrate, and a nano-crystalline surface Ag layer. There are also WO3 and Ag2O phases at the surface. After UL overload/temperature-rise testing, there is Ag loss giving a porous W-rich layer at the contact surface. In addition to binary oxides, we observe the formation of Ag2WO4. After UL endurance testing, material is swept across the surface by the breaker action giving a W-rich eroded porous surface on one side and a build-up of mixed oxides on the other. After UL short-circuit testing, a W crust forms due to melting and re-solidification of W and vaporization of Ag, and mid-plane cracks form due to the severe thermal gradients. There is a strong correlation between the observed microstructural features and the contact resistance measurements obtained from these samples.

  3. Open circuit voltage profiling as diagnostic tool during stack lifetime testing

    NASA Astrophysics Data System (ADS)

    Stumper, J.; Rahmani, R.; Fuss, F.

    A 10-cell Mk 9 stack was characterized using current/voltage mapping during automotive drive cycle testing. A minimally invasive current mapping technique was used to determine localized polarization curves which together with open circuit voltage (OCV) profile measurements provide useful information about crossover leak formation and location. Through a systematic variation of reactant gas pressures it is further possible to distinguish between electrical shorts, diffusive and convective leaks.

  4. Dual stator winding variable speed asynchronous generator: magnetic equivalent circuit with saturation, FEM analysis and experiments

    NASA Astrophysics Data System (ADS)

    Tutelea, L. N.; Muntean, N.; Deaconu, S. I.; Cunţan, C. D.

    2016-02-01

    The authors carried out a theoretical and experimental study of dual stator winding squirrel cage asynchronous generator (DSWA) behaviour in the presence of saturation regime (non-sinusoidal) due to the variable speed operation. The main aims are the determination of the relations of calculating the equivalent parameters of the machine windings, FEM validation of parameters and characteristics with free FEMM 4.2 computing software and the practice experimental tests for verifying them. Issue is limited to three phase range of double stator winding cage-asynchronous generator of small sized powers, the most currently used in the small adjustable speed wind or hydro power plants. The tests were carried out using three-phase asynchronous generator having rated power of 6 [kVA].

  5. Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring.

    PubMed

    Altet, J; Mateo, D; Perpiñà, X; Grauby, S; Dilhaire, S; Jordà, X

    2011-09-01

    This work presents an alternative characterization strategy to quantify the nonlinear behavior of temperature sensing systems. The proposed approach relies on measuring the temperature under thermal sinusoidal steady state and observing the intermodulation products that are generated within the sensing system itself due to its nonlinear temperature-output voltage characteristics. From such intermodulation products, second-order interception points can be calculated as a figure of merit of the measuring system nonlinear behavior. In this scenario, the present work first shows a theoretical analysis. Second, it reports the experimental results obtained with three thermal sensing techniques used in integrated circuits.

  6. Generation of copper rich metallic phases from waste printed circuit boards

    SciTech Connect

    Cayumil, R.; Khanna, R.; Ikram-Ul-Haq, M.; Rajarao, R.; Hill, A.; Sahajwalla, V.

    2014-10-15

    Highlights: • Recycling and material recovery from waste printed circuit boards is very complex. • Thermoset polymers, ceramics and metals are present simultaneously in waste PCBs. • Heat treatment of PCBs was carried out at 1150 °C under inert conditions. • Various metallic phases could be segregated out as copper based metallic droplets. • Carbon and ceramics residues can be further recycled in a range of applications. - Abstract: The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150 °C under argon gas flowing at 1 L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the

  7. Super NiCd Open-Circuit Storage and Low Earth Orbit (LEO) Life Test Evaluation

    NASA Technical Reports Server (NTRS)

    Baer, Jean Marie; Hwang, Warren C.; Ang, Valerie J.; Hayden, Jeff; Rao, Gopalakrishna; Day, John H. (Technical Monitor)

    2002-01-01

    This presentation discusses Air Force tests performed on super NiCd cells to measure their performance under conditions simulating Low Earth Orbit (LEO) conditions. Super NiCd cells offer potential advantages over existing NiCd cell designs including advanced cell design with improved separator material and electrode making processes, but handling and storage requires active charging. These tests conclude that the super NiCd cells support generic Air Force qualifications for conventional LEO missions (up to five years duration) and that handling and storage may not actually require active charging as previously assumed. Topics covered include: Test Plan, Initial Characterization Tests, Open-Circuit Storage Tests, and post storage capacities.

  8. Infrared Thermography as Applied to Thermal Testing of Power Systems Circuit Boards.

    NASA Astrophysics Data System (ADS)

    Miles, Jonathan James

    All operational electronic equipment dissipates some amount of energy in the form of infrared radiation. Faulty electronic components on a printed circuit board can be categorized as hard (functional) or soft (latent functional). Hard faults are those which are detected during a conventional manufacturing electronic test process. Soft failures, in contrast, are those which are undetectable through conventional testing, but which manifest themselves after a product has been placed into service. Such field defective modules ultimately result in operational failure and subsequently enter a manufacturer's costly repair process. While thermal imaging systems are being used increasingly in the electronic equipment industry as a product-testing tool, applications have primarily been limited to product design or repair processes, with minimal use in a volume manufacturing environment. Use of thermal imaging systems in such an environment has mostly been limited to low-volume products or random screening of high-volume products. Thermal measurements taken in a manufacturing environment are often taken manually, thus defeating their capability of rapid data acquisition and constraining their full potential in a high-volume manufacturing process. Integration of a thermal measurement system with automated testing equipment is essential for optimal use of expensive infrared measurement tools in a high-volume manufacturing environment. However, such a marriage presents problems with respect to both existing manufacturing test processes and infrared measurement techniques. Methods are presented in this dissertation to test automatically for latent faults, those which elude detection during conventional electronic testing, on printed circuit boards. These methods are intended for implementation in a volume manufacturing environment and involve the application of infrared imaging tools. Successful incorporation of infrared testing into existing test processes requires that: PASS

  9. Examining students' understanding of electrical circuits through multiple-choice testing and interviews

    NASA Astrophysics Data System (ADS)

    Engelhardt, Paula Vetter

    Research has shown that both high school and university students have misconceptions about direct current resistive electric circuits. At present, there are no standard diagnostic examinations in electric circuits. Such an instrument would be useful in determining what conceptual problems students have either before or after instruction. The information provided by the exam can be used by classroom instructors to evaluate their instructional methods and the progress and conceptual problems of their students. It can be used to evaluate curricular packages and/or other supplemental materials for their effectiveness in overcoming students' conceptual difficulties. Two versions of a diagnostic instrument known as Determining and Interpreting Resistive Electric circuits Concepts Tests (DIRECT) were developed, each consisting of 29 questions. DIRECT was administered to groups of high school and university students in the United States, Canada and Germany. The students had completed their study of electrostatics and direct current electric circuits prior to taking the exam. Individual interviews were conducted after the administration of version 1.0 to determine how students were interpreting the questions and to uncover their reasoning behind their selections. The analyses indicate that students, especially females, tend to hold multiple misconceptions, even after instruction. The idea that the battery is a constant source of current was used most often in answering the questions. Although students tend to use different misconceptions for each question presented, they do use misconceptions associated with the global objective of the question. Students' definitions of terms used on the exam and their misconceptions were examined. Students tended to confuse terms, especially current. They assigned the properties of current to voltage and/or resistance. One of the major findings from the study was that students were able to translate easily from a "realistic" representation

  10. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  11. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 49 Transportation 4 2013-10-01 2013-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  12. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance...

  13. BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability. Ph.D. Thesis

    NASA Technical Reports Server (NTRS)

    Chen, Chung-Hsing

    1992-01-01

    In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

  14. Development and Analysis of Cold Trap for Use in Fission Surface Power-Primary Test Circuit

    NASA Technical Reports Server (NTRS)

    Wolfe, T. M.; Dervan, C. A.; Pearson, J. B.; Godfroy, T. J.

    2012-01-01

    The design and analysis of a cold trap proposed for use in the purification of circulated eutectic sodium potassium (NaK-78) loops is presented. The cold trap is designed to be incorporated into the Fission Surface Power-Primary Test Circuit (FSP-PTC), which incorporates a pumped NaK loop to simulate in-space nuclear reactor-based technology using non-nuclear test methodology as developed by the Early Flight Fission-Test Facility. The FSP-PTC provides a test circuit for the development of fission surface power technology. This system operates at temperatures that would be similar to those found in a reactor (500-800 K). By dropping the operating temperature of a specified percentage of NaK flow through a bypass containing a forced circulation cold trap, the NaK purity level can be increased by precipitating oxides from the NaK and capturing them within the cold trap. This would prevent recirculation of these oxides back through the system, which may help prevent corrosion.

  15. Thermal hydraulic performance testing of printed circuit heat exchangers in a high-temperature helium test facility

    SciTech Connect

    Sai K. Mylavarapu; Xiaodong Sun; Richard E. Glosup; Richard N. Christensen; Michael W. Patterson

    2014-04-01

    In high-temperature gas-cooled reactors, such as a very high temperature reactor (VHTR), an intermediate heat exchanger (IHX) is required to efficiently transfer the core thermal output to a secondary fluid for electricity generation with an indirect power cycle and/or process heat applications. Currently, there is no proven high-temperature (750–800 °C or higher) compact heat exchanger technology for high-temperature reactor design concepts. In this study, printed circuit heat exchanger (PCHE), a potential IHX concept for high-temperature applications, has been investigated for their heat transfer and pressure drop characteristics under high operating temperatures and pressures. Two PCHEs, each having 10 hot and 10 cold plates with 12 channels (semicircular cross-section) in each plate are fabricated using Alloy 617 plates and tested for their performance in a high-temperature helium test facility (HTHF). The PCHE inlet temperature and pressure were varied from 85 to 390 °C/1.0–2.7 MPa for the cold side and 208–790 °C/1.0–2.7 MPa for the hot side, respectively, while the mass flow rate of helium was varied from 15 to 49 kg/h. This range of mass flow rates corresponds to PCHE channel Reynolds numbers of 950 to 4100 for the cold side and 900 to 3900 for the hot side (corresponding to the laminar and laminar-to-turbulent transition flow regimes). The obtained experimental data have been analyzed for the pressure drop and heat transfer characteristics of the heat transfer surface of the PCHEs and compared with the available models and correlations in the literature. In addition, a numerical treatment of hydrodynamically developing and hydrodynamically fully-developed laminar flow through a semicircular duct is presented. Relations developed for determining the hydrodynamic entrance length in a semicircular duct and the friction factor (or pressure drop) in the hydrodynamic entry length region for laminar flow through a semicircular duct are given. Various

  16. Optimal Test Design with Rule-Based Item Generation

    ERIC Educational Resources Information Center

    Geerlings, Hanneke; van der Linden, Wim J.; Glas, Cees A. W.

    2013-01-01

    Optimal test-design methods are applied to rule-based item generation. Three different cases of automated test design are presented: (a) test assembly from a pool of pregenerated, calibrated items; (b) test generation on the fly from a pool of calibrated item families; and (c) test generation on the fly directly from calibrated features defining…

  17. Short-Circuit Tests and Simulations with a SCFCL Modular Assembly

    NASA Astrophysics Data System (ADS)

    Sousa, W. T. B. de; Polasek, A.; Dias, R.; Silva, F. A.; Lopes, F. C.; Filho, O. Orsino; de Andrade, R.

    Short-circuit tests and simulations carried out with a resistive SCFCL modular assembly are presented. Each SCFCL moduleconsistsofaBSCCO2212bulkcoilwithacritical currentofabout520Aat77K.Seriesandparallel connection were tested. In series connection, prospectivecurrent as high as 67 kArms was limited to about 11 kApeak in the first peak. In parallel connection, prospective current as high as 65 kArms was limited to about 20 kApeak in the first peak. Low fault current tests were also carried out (current peaksof about3Ic)and in this case the SCFCL module takes more time to actuate, being considered satisfactory for "inrush" currents. Computational simulations were done considering the bulk coil E-J curve and heat transfers between SCFCL components and the LN2 bath. The simulations can reasonably predict the performance of the SCFCL assembly and provide additional information such as the temperature rise of superconductor and shunt.

  18. New microwave excitation signal generating circuit for quantum frequency standard on the atoms of caesium Cs133

    NASA Astrophysics Data System (ADS)

    Petrov, A. A.; Davydov, V. V.

    2016-03-01

    In this work the study, design, development and experimental results of a new microwave excitation signal generating circuit are presented. New design of this circuit is based on the method of direct digital synthesis. The results of theoretical calculations and experimental researches show that the new design not only has a high precision, but also has an improvement in the spectral characteristics of the output signal. Range of generated output frequencies is expanded, that leads to the possibility of detuning the frequency of the neighboring resonance of spectral line and adjust the C-field in quantum frequency standard. Experimental research of the metrological characteristics of the quantum frequency standard on the atoms of caesium with a new functional unit showed an improvement in the daily frequency stability.

  19. Wein bridge oscillator circuit

    NASA Technical Reports Server (NTRS)

    Lipoma, P. C.

    1971-01-01

    Circuit with minimum number of components provides stable outputs of 2 to 8 volts at frequencies of .001 to 100 kHz. Oscillator exhibits low power consumption, portability, simplicity, and drive capability, it has application as loudspeaker tester and audible alarm, as well as in laboratory and test generators.

  20. A rule-based software test data generator

    NASA Technical Reports Server (NTRS)

    Deason, William H.; Brown, David B.; Chang, Kai-Hsiung; Cross, James H., II

    1991-01-01

    Rule-based software test data generation is proposed as an alternative to either path/predicate analysis or random data generation. A prototype rule-based test data generator for Ada programs is constructed and compared to a random test data generator. Four Ada procedures are used in the comparison. Approximately 2000 rule-based test cases and 100,000 randomly generated test cases are automatically generated and executed. The success of the two methods is compared using standard coverage metrics. Simple statistical tests showing that even the primitive rule-based test data generation prototype is significantly better than random data generation are performed. This result demonstrates that rule-based test data generation is feasible and shows great promise in assisting test engineers, especially when the rule base is developed further.

  1. Evaluation of the flexibility of silver circuits screen-printed on polyimide with an environmental reliability test.

    PubMed

    Kim, Kwang-Seok; Lee, Young-Chul; Ahn, Jee-Hyuk; Jung, Seung-Boo

    2011-07-01

    The flexibility of screen-printed silver (Ag) circuits on a polyimide (PI) substrate was investigated under a high temperature and relative humidity (RH). The conductive circuits were constructed on a PI film with a commercial Ag nanopaste via screen printing. The printed patterns were sintered at 200 degrees C for 30 min in a box-type furnace, after which they were placed in a chamber at 85 degrees C/85% RH for various durations: 100, 300, 500, and 1000 h. The Institute for Interconnecting and Packaging Electronic Circuits (IPC) flexural resistance endurance test was conducted to measure the flexibility of the conductive circuits, and the flexibility of the printed patterns was evaluated by detecting the variation of the electrical resistance. The flexibility of the screen-printed conductive circuits decreased as the duration of the 85 degrees C/85% RH test increased. After the 1000 h run of the 85 degrees C/85% RH test, the flexibility of the printed circuits was almost halved compared to that after the 100 h test. To demonstrate the decreased flexibility, the microstructural evolution and partial volume were investigated with a field emission scanning electron microscope (FE-SEM) and a 3D surface profiler, respectively.

  2. Magnetic Circuit Model of PM Motor-Generator to Predict Radial Forces

    NASA Technical Reports Server (NTRS)

    McLallin, Kerry (Technical Monitor); Kascak, Peter E.; Dever, Timothy P.; Jansen, Ralph H.

    2004-01-01

    A magnetic circuit model is developed for a PM motor for flywheel applications. A sample motor is designed and modeled. Motor configuration and selection of materials is discussed, and the choice of winding configuration is described. A magnetic circuit model is described, which includes the stator back iron, rotor yoke, permanent magnets, air gaps and the stator teeth. Iterative solution of this model yields flux linkages, back EMF, torque, power, and radial force at the rotor caused by eccentricity. Calculated radial forces are then used to determine motor negative stiffness.

  3. Generation of copper rich metallic phases from waste printed circuit boards.

    PubMed

    Cayumil, R; Khanna, R; Ikram-Ul-Haq, M; Rajarao, R; Hill, A; Sahajwalla, V

    2014-10-01

    The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150°C under argon gas flowing at 1L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the metallic phase. The heat treatment temperature was chosen to be above the melting point of copper; molten copper helped to concentrate metallic constituents and their separation from the carbonaceous residue and the slag. Inert atmosphere prevented the re-oxidation of metals and the loss of carbon in the gaseous fraction. Recycling e-waste is expected to lead to enhanced metal recovery, conserving natural resources and providing an environmentally

  4. Generation of copper rich metallic phases from waste printed circuit boards.

    PubMed

    Cayumil, R; Khanna, R; Ikram-Ul-Haq, M; Rajarao, R; Hill, A; Sahajwalla, V

    2014-10-01

    The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150°C under argon gas flowing at 1L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the metallic phase. The heat treatment temperature was chosen to be above the melting point of copper; molten copper helped to concentrate metallic constituents and their separation from the carbonaceous residue and the slag. Inert atmosphere prevented the re-oxidation of metals and the loss of carbon in the gaseous fraction. Recycling e-waste is expected to lead to enhanced metal recovery, conserving natural resources and providing an environmentally

  5. Development, testing, and demonstration of an optimal fine coal cleaning circuit

    SciTech Connect

    Mishra, M.; Placha, M.; Bethell, P.

    1995-11-01

    The overall objective of this project is to improve the efficiency of fine coal cleaning. The project will be completed in two phases: bench-scale testing and demonstration of four advanced flotation cells and; in-plant proof-of-concept (POC) pilot plant testing of two flotation cells individually and in two-stage combinations. The goal is to ascertain if a two-stage circuit can result in reduced capital and operating costs while achieving improved separation efficiency. The plant selected for this project, Cyprus Emerald Coal Preparation plant, cleans 1200 tph of raw coal. The plant produces approximately 4 million tonnes of clean coal per year at an average as received energy content of 30.2 MJ/Kg (13,000 Btu/lb).

  6. Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA

    SciTech Connect

    Cole, E.I. Jr.

    1995-09-01

    Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy CIVA (LECIVA) are three new failure analysis imaging techniques developed to quickly localize defects on ICs. All three techniques utilize the voltage fluctuations of a constant current power supply as an electron or photon beam is scanned across an IC. CIVA and LECIVA yield rapid localization of open interconnections on ICs. LIVA allows quick localization of open-circuited and damaged semiconductor junctions. LIVA can also be used to image transistor logic states and can be performed from the backside of ICs with an infrared laser source. The physics of signal generation for each technique and examples of their use in failure analysis are described.

  7. Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space

    NASA Technical Reports Server (NTRS)

    Johnston, Allan H.; Rax, Bernard G.

    2006-01-01

    This paper discusses mechanisms and circuit-related factors that affect the degradation of linear integrated circuits from radiation in space. For some circuits there is sufficient degradation to affect performance at total dose levels below 4 krad(Si) because the circuit design techniques require higher gain for the pnp transistors that are the most sensitive to radiation. Qualification methods are recommended that include displacement damage as well as ionization damage.

  8. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 47 Telecommunication 5 2014-10-01 2014-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  9. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 47 Telecommunication 5 2013-10-01 2013-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  10. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 47 Telecommunication 5 2012-10-01 2012-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  11. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuits shall be actuated in any manner which causes the circuit breaker to open. All components of the... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current...

  12. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... circuits shall be actuated in any manner which causes the circuit breaker to open. All components of the... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current...

  13. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuits shall be actuated in any manner which causes the circuit breaker to open. All components of the... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current...

  14. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuits shall be actuated in any manner which causes the circuit breaker to open. All components of the... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current...

  15. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuits shall be actuated in any manner which causes the circuit breaker to open. All components of the... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current...

  16. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 47 Telecommunication 5 2010-10-01 2010-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  17. Functional convergence of developmentally and adult-generated granule cells in dentate gyrus circuits supporting hippocampus-dependent memory.

    PubMed

    Stone, Scellig S D; Teixeira, Cátia M; Zaslavsky, Kirill; Wheeler, Anne L; Martinez-Canabal, Alonso; Wang, Afra H; Sakaguchi, Masanori; Lozano, Andres M; Frankland, Paul W

    2011-12-01

    In the hippocampus, the production of dentate granule cells (DGCs) persists into adulthood. As adult-generated neurons are thought to contribute to hippocampal memory processing, promoting adult neurogenesis therefore offers the potential for restoring mnemonic function in the aged or diseased brain. Within this regenerative context, one key issue is whether developmentally generated and adult-generated DGCs represent functionally equivalent or distinct neuronal populations. To address this, we labeled separate cohorts of developmentally generated and adult-generated DGCs and used immunohistochemical approaches to compare their integration into circuits supporting hippocampus-dependent memory in intact mice. First, in the water maze task, rates of integration of adult-generated DGCs were regulated by maturation, with maximal integration not occurring until DGCs were five or more weeks in age. Second, these rates of integration were equivalent for embryonically, postnatally, and adult-generated DGCs. Third, these findings generalized to another hippocampus-dependent task, contextual fear conditioning. Together, these experiments indicate that developmentally generated and adult-generated DGCs are integrated into hippocampal memory networks at similar rates, and suggest a functional equivalence between DGCs generated at different developmental stages. PMID:20824726

  18. Design and testing of an all-digital readout integrated circuit for infrared focal plane arrays

    NASA Astrophysics Data System (ADS)

    Kelly, Michael; Berger, Robert; Colonero, Curtis; Gregg, Mark; Model, Joshua; Mooney, Daniel; Ringdahl, Eric

    2005-08-01

    The digital focal plane array (DFPA) project demonstrates the enabling technologies necessary to build readout integrated circuits for very large infrared focal plane arrays (IR FPAs). Large and fast FPAs are needed for a new class of spectrally diverse sensors. Because of the requirement for high-resolution (low noise) sampling, and because of the sample rate needed for rapid acquisition of high-resolution spectra, it is highly desirable to perform analog-to-digital (A/D) conversion right at the pixel level. A dedicated A/D converter located under every pixel in a one-million-plus element array, and all-digital readout integrated circuits will enable multi- and hyper-spectral imaging systems with unprecedented spatial and spectral resolution and wide area coverage. DFPAs provide similar benefits to standard IR imaging systems as well. We have addressed the key enabling technologies for realizing the DFPA architecture in this work. Our effort concentrated on demonstrating a 60-micron footprint, 14-bit A/D converter and 2.5 Gbps, 16:1 digital multiplexer, the most basic components of the sensor. The silicon test chip was fabricated in a 0.18-micron CMOS process, and was designed to operate with HgxCd1-xTe detectors at cryogenic temperatures. Two A/D designs, one using static logic and one using dynamic logic, were built and tested for performance and power dissipation. Structures for evaluating the bit-error-rate of the multiplexer on-chip and through a differential output driver were implemented for a complete performance assessment. A unique IC probe card with fixtures to mount into an evacuated, closed-cycle helium dewar were also designed for testing up to 2.5 Gbps at temperatures as low as 50 K.

  19. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  20. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  1. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  2. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  3. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  4. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  5. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is...

  6. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and...

  7. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, J. A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  8. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyses required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  9. Approval tests and standards for closed-circuit escape respirators. Final rule.

    PubMed

    2012-03-01

    This final rule announces updated requirements that the National Institute for Occupational Safety and Health (NIOSH or Agency), located within the Centers for Disease Control and Prevention (CDC) in the Department of Health and Human Services (HHS or Department), will employ to test and approve closed-circuit respirators used for escaping atmospheres considered to be immediately dangerous to life and health, including such respirators required by the Mine Safety and Health Administration (MSHA) for use in underground coal mines. NIOSH and MSHA jointly review and approve this type of respirator used for mine emergencies under regulations concerning approval of respiratory protective devices. NIOSH also approves these respirators for use in other work environments where escape equipment may be provided to workers, such as on vessels operated by U.S. Navy and Coast Guard personnel. The purpose of these updated requirements is to enable NIOSH and MSHA to more effectively ensure the performance, reliability, and safety of CCERs.

  10. Variability-aware compact modeling and statistical circuit validation on SRAM test array

    NASA Astrophysics Data System (ADS)

    Qiao, Ying; Spanos, Costas J.

    2016-03-01

    Variability modeling at the compact transistor model level can enable statistically optimized designs in view of limitations imposed by the fabrication technology. In this work we propose a variability-aware compact model characterization methodology based on stepwise parameter selection. Transistor I-V measurements are obtained from bit transistor accessible SRAM test array fabricated using a collaborating foundry's 28nm FDSOI technology. Our in-house customized Monte Carlo simulation bench can incorporate these statistical compact models; and simulation results on SRAM writability performance are very close to measurements in distribution estimation. Our proposed statistical compact model parameter extraction methodology also has the potential of predicting non-Gaussian behavior in statistical circuit performances through mixtures of Gaussian distributions.

  11. Approval tests and standards for closed-circuit escape respirators. Final rule.

    PubMed

    2012-03-01

    This final rule announces updated requirements that the National Institute for Occupational Safety and Health (NIOSH or Agency), located within the Centers for Disease Control and Prevention (CDC) in the Department of Health and Human Services (HHS or Department), will employ to test and approve closed-circuit respirators used for escaping atmospheres considered to be immediately dangerous to life and health, including such respirators required by the Mine Safety and Health Administration (MSHA) for use in underground coal mines. NIOSH and MSHA jointly review and approve this type of respirator used for mine emergencies under regulations concerning approval of respiratory protective devices. NIOSH also approves these respirators for use in other work environments where escape equipment may be provided to workers, such as on vessels operated by U.S. Navy and Coast Guard personnel. The purpose of these updated requirements is to enable NIOSH and MSHA to more effectively ensure the performance, reliability, and safety of CCERs. PMID:22420059

  12. "MSTGen": Simulated Data Generator for Multistage Testing

    ERIC Educational Resources Information Center

    Han, Kyung T.

    2013-01-01

    Multistage testing, or MST, was developed as an alternative to computerized adaptive testing (CAT) for applications in which it is preferable to administer a test at the level of item sets (i.e., modules). As with CAT, the simulation technique in MST plays a critical role in the development and maintenance of tests. "MSTGen," a new MST…

  13. Theoretical study of the circuit architecture of the basic CFOA and testing techniques

    NASA Astrophysics Data System (ADS)

    Tammam, A. A.; Hayatleh, K.; Barker, S.; Terzopoulos, N.

    2016-09-01

    This paper examines the closed-loop characteristics of the basic Current-Feedback Operational Amplifier (CFOA), and in particular, the dynamic response. Additionally, it also examines the design and advantages of the CFOA regarding its ability to provide a significantly constant closed-loop bandwidth for closed-loop voltage gain. Secondly, the almost limitless slew-rate provided by the class AB input stage that makes it superior to the voltage-mode operational amplifier (VOA) counterpart. Additionally, this paper also concerns the definitions and measurements of the terminal parameters of the CFOA, regarded as a 'black box'. It does not deal with the way that these parameters are related to the properties of the active passive and active components of a particular circuit configuration. Simulation is used in terminal parameter determination: this brings with it the facility of using test conditions that would not normally prevail in a laboratory test on silicon implementations of the CFOAs. Thus, we can apply 1mA and 1mV test signals from, respectively, infinite and zero source impedances that range in frequency from d.c to some tens of GHz. Also, we assume the existence of resistors with identical Ohmic value and very high value ideal capacitors. Where appropriate, practical test methods are referred to physical laboratory prototypes.

  14. Implementation of 140 Gb/s true random bit generator based on a chaotic photonic integrated circuit.

    PubMed

    Argyris, Apostolos; Deligiannidis, Stavros; Pikasis, Evangelos; Bogris, Adonis; Syvridis, Dimitris

    2010-08-30

    In the present work a photonic integrated circuit (PIC) that emits broadband chaotic signals is employed for ultra-fast generation of true random bit sequences. Chaotic dynamics emerge from a DFB laser, accompanied by a monolithic integrated 1-cm long external cavity (EC) that provides controllable optical feedback. The short length minimizes the existence of external cavity modes, so flattened broadband spectra with minimized intrinsic periodicities can emerge. After sampling and quantization--without including optical de-correlation techniques and using most significant bits (MSB) elimination post-processing--truly random bit streams with bit-rates as high as 140 Gb/s can be generated. Finally, the extreme robustness of the random bit generator for adaptive bit-rate operation and for various operating conditions of the PIC is demonstrated.

  15. Module generation for self-testing integrated systems

    NASA Astrophysics Data System (ADS)

    Vanriessen, Ronald Pieter

    Hardware used for self test in VLSI (Very Large Scale Integrated) systems is reviewed, and an architecture to control the test hardware in an integrated system is presented. Because of the increase of test times, the use of self test techniques has become practically and economically viable for VLSI systems. Beside the reduction in test times and costs, self test also provides testing at operational speeds. Therefore, a suitable combination of scan path and macrospecific (self) tests is required to reduce test times and costs. An expert system that can be used in a silicon compilation environment is presented. The approach requires a minimum of testability knowledge from a system designer. A user friendly interface was described for specifying and modifying testability requirements by a testability expert. A reason directed backtracking mechanism is used to solve selection failures. Both the hierarchical testable architecture and the design for testability expert system are used in a self test compiler. The definition of a self test compiler was given. A self test compiler is a software tool that selects an appropriate test method for every macro in a design. The hardware to control a macro test will be included in the design automatically. As an example, the integration of the self-test compiler in a silicon compilation system PIRAMID was described. The design of a demonstrator circuit by self test compiler is described. This circuit consists of two self testable macros. Control of the self test hardware is carried out via the test access port of the boundary scan standard.

  16. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization.

    PubMed

    Altet, J; Aldrete-Vidrio, E; Mateo, D; Salhi, A; Grauby, S; Claeys, W; Dilhaire, S; Perpiñà, X; Jordà, X

    2009-02-01

    Heterodyne strategies can be used to characterize thermal coupling in integrated circuits when the electrical bandwidth of the dissipating circuit is beyond the bandwidth of the thermal coupling mechanism. From the characterization of the thermal coupling, two possible applications are described: extraction of characteristics of the dissipating circuit (the determination of the center frequency of a low-noise amplifier) and the extraction of the thermal coupling transfer function. PMID:19256677

  17. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 20 2013-07-01 2013-07-01 false Transient test cycle generation. 86... Procedures § 86.1333-90 Transient test cycle generation. (a) The heavy-duty transient engine cycles for Otto... question must be used. The generation of the maximum torque curve is described in § 86.1332. (3) The...

  18. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 19 2011-07-01 2011-07-01 false Transient test cycle generation. 86... Procedures § 86.1333-90 Transient test cycle generation. (a) The heavy-duty transient engine cycles for Otto... question must be used. The generation of the maximum torque curve is described in § 86.1332. (3) The...

  19. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 20 2012-07-01 2012-07-01 false Transient test cycle generation. 86... Procedures § 86.1333-90 Transient test cycle generation. (a) The heavy-duty transient engine cycles for Otto... question must be used. The generation of the maximum torque curve is described in § 86.1332. (3) The...

  20. 40 CFR 86.1333-90 - Transient test cycle generation.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 40 Protection of Environment 19 2010-07-01 2010-07-01 false Transient test cycle generation. 86... Procedures § 86.1333-90 Transient test cycle generation. (a) The heavy-duty transient engine cycles for Otto... question must be used. The generation of the maximum torque curve is described in § 86.1332. (3) The...

  1. Effect of High-Humidity Testing on Material Parameters of Flexible Printed Circuit Board Materials

    NASA Astrophysics Data System (ADS)

    Lahokallio, Sanna; Saarinen, Kirsi; Frisk, Laura

    2013-09-01

    The tendency of polymers to absorb moisture impairs especially their electrical and mechanical properties. These are important characteristics for printed circuit board (PCB) materials, which should provide mechanical support as well as electrical insulation in many different environments in order to guarantee safe operation for electrical devices. Moreover, the effects of moisture are accelerated at increased temperatures. In this study, three flexible PCB dielectric materials, namely polyimide (PI), fluorinated ethylene-propylene (FEP), and polyethylene terephthalate (PET), were aged over different periods of time in a high-humidity test, in which the temperature was 85°C and relative humidity 85%. After aging, the changes in the structure of the polymers were studied by determining different material parameters such as modulus of elasticity, glass-transition temperature, melting point, coefficient of thermal expansion, water absorption, and crystallinity, and changes in the chemical structure with several techniques including thermomechanical analysis, differential scanning calorimetry, Fourier-transform infrared spectroscopy, moisture analysis, and a precision scale. The results showed that PI was extremely stable under the aging conditions and therefore an excellent choice for electrical applications under harsh conditions. Similarly, FEP proved to be relatively stable under the applied aging conditions. However, its crystallinity increased markedly during aging, and after 6000 h of aging the results indicated oxidation. PET suffered from hydrolysis during the test, leading to its embrittlement after 2000 h of aging.

  2. Flow Quality Studies of the NASA Glenn Research Center Icing Research Tunnel Circuit (1995 Tests)

    NASA Technical Reports Server (NTRS)

    Arrington, E. Allen; Kee-Bowling, Bonnie A.; Gonsalez, Jose C.

    2000-01-01

    The purpose of conducting the flow-field surveys described in this report was to more fully document the flow quality in several areas of the tunnel circuit in the NASA Glenn Research Center Icing Research Tunnel. The results from these surveys provide insight into areas of the tunnel that were known to exhibit poor flow quality characteristics and provide data that will be useful to the design of flow quality improvements and a new heat exchanger for the facility. An instrumented traversing mechanism was used to survey the flow field at several large cross sections of the tunnel loop over the entire speed range of the facility. Flow-field data were collected at five stations in the tunnel loop, including downstream of the fan drive motor housing, upstream and downstream of the heat exchanger, and upstream and downstream of the spraybars located in the settling chamber upstream of the test section. The data collected during these surveys greatly expanded the data base describing the flow quality in each of these areas. The new data matched closely the flow quality trends recorded from earlier tests. Data collected downstream of the heat exchanger and in the settling chamber showed how the configuration of the folded heat exchanger affected the pressure, velocity, and flow angle distributions in these areas. Smoke flow visualization was also used to qualitatively study the flow field in an area downstream of the drive fan and in the settling chamber/contraction section.

  3. Adding Test Generation to the Teaching Machine

    ERIC Educational Resources Information Center

    Bruce-Lockhart, Michael; Norvell, Theodore; Crescenzi, Pierluigi

    2009-01-01

    We propose an extension of the Teaching Machine project, called Quiz Generator, that allows instructors to produce assessment quizzes in the field of algorithm and data structures quite easily. This extension makes use of visualization techniques and is based on new features of the Teaching Machine that allow third-party visualizers to be added as…

  4. Techniques for testing the quality of parallel pseudorandom number generators

    SciTech Connect

    Cuccaro, S.A.; Mascagni, M.; Pryor, D.V.

    1995-12-01

    Ensuring that pseudorandom number generators have good randomness properties is more complicated in a multiprocessor implementation than in the uniprocessor case. We discuss simple extensions of uniprocessor testing for SIMD parallel streams, and develop in detail a repeatability test for the SPMD paradigm. Examples of the application of these tests to an additive tagged-Fibonacci generator are also given.

  5. Test-Aerosol Generator For Calibrating Particle Counters

    NASA Technical Reports Server (NTRS)

    Mogan, Paul A.; Adams, Alois J.; Schwindt, Christian J.; Hodge, Timothy R.; Mallow, Tim J.; Duong, Anh A.; Bukauskas, Vyto V.

    1996-01-01

    Apparatus generates clean, stable aerosol stream for use in testing and calibrating laser-based aerosol-particle counter. Size and concentration of aerosol particles controlled to ensure accurate calibration. Cheap, widely available medical nebulizers used to generate aerosols.

  6. Characterization of devices, circuits, and high-temperature superconductor transmission lines by electro-optic testing

    NASA Technical Reports Server (NTRS)

    Whitaker, John F.

    1991-01-01

    The development of a capability for testing transmission lines, devices, and circuits using the optically-based technique of electro-optics sampling was the goal of this project. Electro-optic network analysis of a high-speed device was demonstrated. The project involved research on all of the facets necessary in order to realize this result, including the discovery of the optimum electronic pulse source, development of an adequate test fixture, improvement of the electro-optic probe tip, and identification of a device which responded at high frequency but did not oscillate in the test fixture. In addition, during the process of investigating patterned high-critical-temperature superconductors, several non-contacting techniques for the determination of the transport properties of high T(sub c) films were developed and implemented. These are a transient, optical pump-probe, time-resolved reflectivity experiment, an impulsive-stimulated Raman scattering experiment, and a terahertz-beam coherent-spectroscopy experiment. The latter technique has enabled us to measure both the complex refractive index of an MgO substrate used for high-T(sub c) films and the complex conductivity of a YBa2Cu3O(7-x) sample. This information was acquired across an extremely wide frequency range: from the microwave to the submillimeter-wave regime. The experiments on the YBCO were conducted without patterning of, or contact to, the thin film. Thus, the need for the more difficult transmission-line experiments was eliminated. Progress in all of these areas was made and is documented in a number of papers. These papers may be found in the section listing the abstracts of the publications that were issued during the course of the research.

  7. Penetration tests in next generation networks

    NASA Astrophysics Data System (ADS)

    Rezac, Filip; Voznak, Miroslav

    2012-06-01

    SIP proxy server is without any doubts centerpiece of any SIP IP telephony infrastructure. It also often provides other services than those related to VoIP traffic. These softswitches are, however, very often become victims of attacks and threats coming from public networks. The paper deals with a system that we developed as an analysis and testing tool to verify if the target SIP server is adequately secured and protected against any real threats. The system is designed as an open-source application, thus allowing independent access and is fully extensible to other test modules.

  8. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1998-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such'as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAxwell's equations by the Finite Integration Algorithm (MAFIA) is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  9. Approximate circuits for increased reliability

    DOEpatents

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-12-22

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  10. Approximate circuits for increased reliability

    DOEpatents

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-08-18

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  11. On-Chip Generation and Manipulation of Entangled Photons Based on Reconfigurable Lithium-Niobate Waveguide Circuits

    NASA Astrophysics Data System (ADS)

    Jin, H.; Liu, F. M.; Xu, P.; Xia, J. L.; Zhong, M. L.; Yuan, Y.; Zhou, J. W.; Gong, Y. X.; Wang, W.; Zhu, S. N.

    2014-09-01

    A consequent tendency toward high-performance quantum information processing is to develop the fully integrated photonic chip. Here, we report the on-chip generation and manipulation of entangled photons based on reconfigurable lithium-niobate waveguide circuits. By introducing a periodically poled structure into the waveguide circuits, two individual photon-pair sources with a controllable electro-optic phase shift are produced within a Hong-Ou-Mandel interferometer, resulting in a deterministically separated identical photon pair. The state is characterized by 92.9±0.9% visibility Hong-Ou-Mandel interference. The photon flux reaches ˜1.4×107 pairs nm-1 mW-1. The whole chip is designed to contain nine similar units to produce identical photon pairs spanning the telecom C and L band by the flexible engineering of nonlinearity. Our work presents a scenario for on-chip engineering of different photon sources and paves the way to fully integrated quantum technologies.

  12. Model Based Analysis and Test Generation for Flight Software

    NASA Technical Reports Server (NTRS)

    Pasareanu, Corina S.; Schumann, Johann M.; Mehlitz, Peter C.; Lowry, Mike R.; Karsai, Gabor; Nine, Harmon; Neema, Sandeep

    2009-01-01

    We describe a framework for model-based analysis and test case generation in the context of a heterogeneous model-based development paradigm that uses and combines Math- Works and UML 2.0 models and the associated code generation tools. This paradigm poses novel challenges to analysis and test case generation that, to the best of our knowledge, have not been addressed before. The framework is based on a common intermediate representation for different modeling formalisms and leverages and extends model checking and symbolic execution tools for model analysis and test case generation, respectively. We discuss the application of our framework to software models for a NASA flight mission.

  13. Generation of multi-qubit entanglement in a superconducting quantum circuit by parallelized parity measurements

    NASA Astrophysics Data System (ADS)

    Poletto, Stefano; Riste', Diego; Huang, Meng-Zi; Bruno, Alessandro; Vesterinen, Visa; Saira, Olli-Pentti; Dicarlo, Leonardo

    2015-03-01

    We present the generation of multi-qubit entanglement using parallelized ancilla-based parity measurements in a five qubit superconducting processor. Two-qubit Bell states and three-qubit GHZ-type states are generated by single and double two-qubit parity measurements on superposition states, respectively, and characterized by both witnessing and state tomography. The protocol for generation of GHZ-type states can be used as the encoding step in the three-qubit bit-flip quantum error correction code, and made deterministic by digital feedback control. We assess its performance by state tomography of the six encoded cardinal states, and compare to the traditional method of encoding by gates. We acknowledge funding from NWO, FOM and EU FP7 project Scale QIT.

  14. Testing to Characterize the Advanced Stirling Radioisotope Generator Engineering Unit

    NASA Technical Reports Server (NTRS)

    Lewandowski, Edward; Schreiber, Jeffrey

    2010-01-01

    The Advanced Stirling Radioisotope Generator (ASRG), a high efficiency generator, is being considered for space missions. Lockheed Martin designed and fabricated an engineering unit (EU), the ASRG EU, under contract to the Department of Energy. This unit is currently undergoing extended operation testing at the NASA Glenn Research Center to generate performance data and validate life and reliability predictions for the generator and the Stirling convertors. It has also undergone performance tests to characterize generator operation while varying control parameters and system inputs. This paper summarizes and explains test results in the context of designing operating strategies for the generator during a space mission and notes expected differences between the EU performance and future generators.

  15. Signal conditioner test set

    NASA Technical Reports Server (NTRS)

    Houck, W. H.; Stigberg, J. D. (Inventor)

    1974-01-01

    A system was developed for testing components contained in a signal conditioning module with a transistor and capacitor included in a circuit. The system includes a housing with a socket into which the module to be tested is plugged. A test switch is provided for selectively connecting a variable load to either a transistor or capacitor in the circuit for testing the operation. A signal generating circuit is provided for generating signals for use in testing the components of the module.

  16. Proposed minimum requirements for the operational characteristics and testing of closed circuit life support system control electronics.

    PubMed

    Kirk, J C

    1998-01-01

    The popularization and transformation of scuba diving into a broadly practiced sport has served to ignite the interest of technically oriented divers into ever more demanding areas. This, along with the gradual release of military data, equipment, and techniques of closed circuit underwater breathing apparatus, has resulted in a virtual explosion of semiclosed and closed circuit systems for divers. Although many of these systems have been carefully thought out by capable designers, the impulse to rush to market with equipment that has not been fully developed and carefully tested is irresistible to marketers. In addition, the presence of systems developed by well-intentioned and otherwise competent designers who are, nonetheless, inexperienced in the field of life support can result in the sale of failure-prone equipment to divers who lack the knowledge and skills to identify deficiencies before disaster occurs. For this reason, a set of industry standards establishing minimum requirements and testing is needed to guide the designers of this equipment, and to protect the user community from incomplete or inadequate design. Many different technologies go into the development of closed circuit scuba. One key area is the design of electronics to monitor and maintain the critical gas mixtures of the closed circuit loop. Much of the system reliability and inherent danger is resident in the design of the circuitry and the software (if any) that runs it. This article will present a set of proposed minimum requirements, with the goal of establishing a dialog for the creation of guidelines for the classification, rating, design, and testing of embedded electronics for life support systems used in closed circuit applications. These guidelines will serve as the foundation for the later creation of a set of industry specifications.

  17. ROBUST CIRCUIT RHYTHMS IN SMALL CIRCUITS ARISE FROM VARIABLE CIRCUIT COMPONENTS AND MECHANISMS

    PubMed Central

    Marder, Eve; Goeritz, Marie L.; Otopalik, Adriane G.

    2014-01-01

    Small central pattern generating circuits found in invertebrates have significant advantages for the study of the circuit mechanisms that generate brain rhythms. Experimental and computational studies of small oscillatory circuits reveal that similar rhythms can arise from disparate mechanisms. Animal-to-animal variation in the properties of single neurons and synapses may underly robust circuit performance, and can be revealed by perturbations. Neuromodulation can produce altered circuit performance but also ensure reliable circuit function. PMID:25460072

  18. Model-Driven Test Generation of Distributed Systems

    NASA Technical Reports Server (NTRS)

    Easwaran, Arvind; Hall, Brendan; Schweiker, Kevin

    2012-01-01

    This report describes a novel test generation technique for distributed systems. Utilizing formal models and formal verification tools, spe cifically the Symbolic Analysis Laboratory (SAL) tool-suite from SRI, we present techniques to generate concurrent test vectors for distrib uted systems. These are initially explored within an informal test validation context and later extended to achieve full MC/DC coverage of the TTEthernet protocol operating within a system-centric context.

  19. Fast and simple scheme for generating NOON states of photons in circuit QED.

    PubMed

    Su, Qi-Ping; Yang, Chui-Ping; Zheng, Shi-Biao

    2014-01-01

    The generation, manipulation and fundamental understanding of entanglement lies at very heart of quantum mechanics. Among various types of entangled states, the NOON states are a kind of special quantum entangled states with two orthogonal component states in maximal superposition, which have a wide range of potential applications in quantum communication and quantum information processing. Here, we propose a fast and simple scheme for generating NOON states of photons in two superconducting resonators by using a single superconducting transmon qutrit. Because only one superconducting qutrit and two resonators are used, the experimental setup for this scheme is much simplified when compared with the previous proposals requiring a setup of two superconducting qutrits and three cavities. In addition, this scheme is easier and faster to implement than the previous proposals, which require using a complex microwave pulse, or a small pulse Rabi frequency in order to avoid nonresonant transitions.

  20. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... particle delivery system shall consist of a blower system and a wind tunnel having a test section...

  1. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... particle delivery system shall consist of a blower system and a wind tunnel having a test section...

  2. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 40 Protection of Environment 5 2010-07-01 2010-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... particle delivery system shall consist of a blower system and a wind tunnel having a test section...

  3. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 5 2011-07-01 2011-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... particle delivery system shall consist of a blower system and a wind tunnel having a test section...

  4. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent....

  5. Testing of a direct drive generator for wind turbines

    SciTech Connect

    Sondergaard, L.M.

    1996-12-31

    The normal drive train of a wind turbine consists a gearbox and a 4 to 8 poles asynchronous generator. The gearbox is an expensive and unreliable components and this paper deals with testing of a direct drive synchronous generator for a gearless wind turbine. The Danish company Belt Electric has constructed and manufactured a 27 kW prototype radial flux PM-generator (DD600). They have used cheap hard ferrite magnets in the rotor of this PM-generator. This generator has been tested at Riso and the test results are investigated and analyzed in this paper. The tests have been done with three different load types (1: resistance; 2: diode rectifier, DC-capacitor, resistance; 3: AC-capacitor, diode rectifier, DC-capacitor, resistance). 1 ref., 9 figs., 5 tabs.

  6. Grumman Windstream 25 wind turbine generator. Final test report

    SciTech Connect

    Sexton, J.H.

    1980-03-01

    The Grumman Windstream 25 Wind Turbine Generator (WTG) tested at the Rocky Flats Small Wind Systems Test Center (WSTC) was one of nineteen Windstream 25's manufactured by Grumman Energy Systems, Inc. The machine was considered a first generation prototype and is no longer being produced. While being tested at the WSTC, the Windstream 25 was still in a developmental stage, and operational problems were experienced during its testing period. It is important to underscore, however, that problems encountered during testing of the machine created valuable gains in experience and data for both Rocky Flats and Grumman personnel. It is believed these gains have contributed significantly to further development of Grumman WTG's.

  7. Gas Generation Testing of Neptunium Oxide at Elevated Temperature

    SciTech Connect

    Duffey, JM

    2004-01-30

    Elevated temperature gas generation tests have been conducted using neptunium dioxide produced on a laboratory scale using the HB-Line Phase II flowsheet. These tests were performed to determine what effect elevated temperatures would have on the neptunium dioxide in comparison to neptunium dioxide tested at ambient temperature. The headspace gas compositions following storage at elevated temperatures associated with normal conditions of transport (NCT) have been measured. These test results show an increase in hydrogen generation rate at elevated temperature and significant removal of oxygen from the headspace gas. The elevated temperature gas generation tests described in this report involved heating small test vessels containing neptunium dioxide and measuring the headspace gas pressure and composition at the end of the test period. Four samples were used in these tests to evaluate the impact of process variables on the gas generation rate. Two samples were calcined to 600 degrees Celsius and two were calcined to 650 degrees Celsius. Each test vessel contained approximately 9.5 g of neptunium dioxide. Following exposure to 75 per cent relative humidity (RH) for five days, these samples were loaded in air and then heated to between 105 and 115 degrees Celsius for about one month. At the conclusion of the test period, the headspace gas of each container was analyzed using a micro-gas chromatograph installed in the glovebox where the experiments were conducted. The pressure, volume, and composition data for the headspace gas samples were used to calculate average H2 generation rates.

  8. Endogenous rhythm and pattern-generating circuit interactions in cockroach motor centres.

    PubMed

    David, Izhak; Holmes, Philip; Ayali, Amir

    2016-09-15

    Cockroaches are rapid and stable runners whose gaits emerge from the intricate, and not fully resolved, interplay between endogenous oscillatory pattern-generating networks and sensory feedback that shapes their rhythmic output. Here we studied the endogenous motor output of a brainless, deafferented preparation. We monitored the pilocarpine-induced rhythmic activity of levator and depressor motor neurons in the mesothoracic and metathoracic segments in order to reveal the oscillatory networks' architecture and interactions. Data analyses included phase relations, latencies between and overlaps of rhythmic bursts, spike frequencies, and the dependence of these parameters on cycle frequency. We found that, overall, ipsilateral connections are stronger than contralateral ones. Our findings revealed asymmetries in connectivity among the different ganglia, in which meta-to-mesothoracic ascending coupling is stronger than meso-to-metathoracic descending coupling. Within-ganglion coupling between the metathoracic hemiganglia is stronger than that in the mesothoracic ganglion. We also report differences in the role and mode of operation of homologue network units (manifested by levator and depressor nerve activity). Many observed characteristics are similar to those exhibited by intact animals, suggesting a dominant role for feedforward control in cockroach locomotion. Based on these data we posit a connectivity scheme among components of the locomotion pattern generating system.

  9. Endogenous rhythm and pattern-generating circuit interactions in cockroach motor centres

    PubMed Central

    David, Izhak; Holmes, Philip

    2016-01-01

    ABSTRACT Cockroaches are rapid and stable runners whose gaits emerge from the intricate, and not fully resolved, interplay between endogenous oscillatory pattern-generating networks and sensory feedback that shapes their rhythmic output. Here we studied the endogenous motor output of a brainless, deafferented preparation. We monitored the pilocarpine-induced rhythmic activity of levator and depressor motor neurons in the mesothoracic and metathoracic segments in order to reveal the oscillatory networks’ architecture and interactions. Data analyses included phase relations, latencies between and overlaps of rhythmic bursts, spike frequencies, and the dependence of these parameters on cycle frequency. We found that, overall, ipsilateral connections are stronger than contralateral ones. Our findings revealed asymmetries in connectivity among the different ganglia, in which meta-to-mesothoracic ascending coupling is stronger than meso-to-metathoracic descending coupling. Within-ganglion coupling between the metathoracic hemiganglia is stronger than that in the mesothoracic ganglion. We also report differences in the role and mode of operation of homologue network units (manifested by levator and depressor nerve activity). Many observed characteristics are similar to those exhibited by intact animals, suggesting a dominant role for feedforward control in cockroach locomotion. Based on these data we posit a connectivity scheme among components of the locomotion pattern generating system. PMID:27422902

  10. Test Input Generation for Red-Black Trees using Abstraction

    NASA Technical Reports Server (NTRS)

    Visser, Willem; Pasareanu, Corina S.; Pelanek, Radek

    2005-01-01

    We consider the problem of test input generation for code that manipulates complex data structures. Test inputs are sequences of method calls from the data structure interface. We describe test input generation techniques that rely on state matching to avoid generation of redundant tests. Exhaustive techniques use explicit state model checking to explore all the possible test sequences up to predefined input sizes. Lossy techniques rely on abstraction mappings to compute and store abstract versions of the concrete states; they explore under-approximations of all the possible test sequences. We have implemented the techniques on top of the Java PathFinder model checker and we evaluate them using a Java implementation of red-black trees.

  11. Feedback-Based Coverage Directed Test Generation: An Industrial Evaluation

    NASA Astrophysics Data System (ADS)

    Ioannides, Charalambos; Barrett, Geoff; Eder, Kerstin

    Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.

  12. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, D.M.

    1996-11-05

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit. 5 figs.

  13. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, David M.

    1996-01-01

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit.

  14. MINET validation study using steam generator test data

    SciTech Connect

    Van Tuyle, G.J.; Guppy, J.G.

    1984-01-01

    Three steam generator transient test cases that were simulated using the MINET computer code are described, with computed results compared against experimental data. The MINET calculations closely agreed with the experiment for both the once-through and the U-tube steam generator test cases. The effort is part of an ongoing effort to validate the MINET computer code for thermal-hydraulic plant systems transient analysis, and strongly supports the validity of the MINET models.

  15. A Power Conditioning Stage Based on Analog-Circuit MPPT Control and a Superbuck Converter for Thermoelectric Generators in Spacecraft Power Systems

    NASA Astrophysics Data System (ADS)

    Sun, Kai; Wu, Hongfei; Cai, Yan; Xing, Yan

    2014-06-01

    A thermoelectric generator (TEG) is a very important kind of power supply for spacecraft, especially for deep-space missions, due to its long lifetime and high reliability. To develop a practical TEG power supply for spacecraft, a power conditioning stage is indispensable, being employed to convert the varying output voltage of the TEG modules to a definite voltage for feeding batteries or loads. To enhance the system reliability, a power conditioning stage based on analog-circuit maximum-power-point tracking (MPPT) control and a superbuck converter is proposed in this paper. The input of this power conditioning stage is connected to the output of the TEG modules, and the output of this stage is connected to the battery and loads. The superbuck converter is employed as the main circuit, featuring low input current ripples and high conversion efficiency. Since for spacecraft power systems reliable operation is the key target for control circuits, a reset-set flip-flop-based analog circuit is used as the basic control circuit to implement MPPT, being much simpler than digital control circuits and offering higher reliability. Experiments have verified the feasibility and effectiveness of the proposed power conditioning stage. The results show the advantages of the proposed stage, such as maximum utilization of TEG power, small input ripples, and good stability.

  16. Global optimization of digital circuits

    NASA Astrophysics Data System (ADS)

    Flandera, Richard

    1991-12-01

    This thesis was divided into two tasks. The first task involved developing a parser which could translate a behavioral specification in Very High-Speed Integrated Circuits (VHSIC) Hardware Description Language (VHDL) into the format used by an existing digital circuit optimization tool, Boolean Reasoning In Scheme (BORIS). Since this tool is written in Scheme, a dialect of Lisp, the parser was also written in Scheme. The parser was implemented is Artez's modification of Earley's Algorithm. Additionally, a VHDL tokenizer was implemented in Scheme and a portion of the VHDL grammar was converted into the format which the parser uses. The second task was the incorporation of intermediate functions into BORIS. The existing BORIS contains a recursive optimization system that optimizes digital circuits by using circuit outputs as inputs into other circuits. Intermediate functions provide a greater selection of functions to be used as circuits inputs. Using both intermediate functions and output functions, the costs of the circuits in the test set were reduced by 43 percent. This is a 10 percent reduction when compared to the existing recursive optimization system. Incorporating intermediate functions into BORIS required the development of an intermediate-function generator and a set of control methods to keep the computation time from increasing exponentially.

  17. The generation effect: a test between single- and multifactor theories.

    PubMed

    Burns, D J

    1990-11-01

    Single- and multifactor accounts of the generation effect (better memory for internally generated items than for externally presented items) were tested. Single-factor theories suggest that generation induces either stimulus-response relational processing or response-oriented processing. Multifactor theories suggest that generation induces both types of processing. In the first three experiments subjects either read or generated responses, and the degree of categorical structure within the list was manipulated. When categorical structure was minimal, large generation effects were observed for free recall and recognition, but not for cued recall. When categorical structure was high, however, a generation effect was observed for cued recall but not for recognition or free recall. A fourth experiment was performed to eliminate an uninteresting interpretation of the results. It is argued that a multifactor account is needed to explain these findings. PMID:2148579

  18. CFFF testing of ceramic elements for MHD generators

    SciTech Connect

    Lineberry, J.T.; Christiansen, P.J.

    1994-12-31

    In September 1992, the POC test LMF5-J was concluded at the CFFF in accordance with the objectives as set for the western coal POC test program. During this activity, a {open_quotes}piggyback{close_quotes} type test was conducted for the Busek Company in partial fulfillment of a DOE Phase II SBIR. A near prototypical design, generator module that was designed and constructed by the Busek Co. was installed in the LMF upstream test train of the CFFF for this test. The module incorporated AlN{sub 2} (ceramic) sidebar elements. The objective of the SBIR Phase II was to evaluate the integrity of this material subject to long duration operation under typical coal-fired MHD generator conditions. A summary of the LMF5-J test at the CFFF and activities and test results relevant to the SBIR Phase II related to the Busek SBIR project are provided.

  19. Ion beam induced charge collection (IBICC) from integrated circuit test structures using a 10 MeV carbon microbeam

    SciTech Connect

    Guo, B. N.; El Bouanani, M.; Duggan, J. L.; McDaniel, F. D.; Renfrow, S. N.; Doyle, B. L.; Walsh, D. S.; Aton, T. J.

    1999-06-10

    As feature sizes of Integrated Circuits (ICs) continue to shrink, the sensitivity of these devices, particularly SRAMs and DRAMs, to natural radiation is increasing. In this paper, the Ion Beam Induced Charge Collection (IBICC) technique is utilized to simulate neutron-induced Si recoil effects in ICs. The IBICC measurements, conducted at the Sandia National Laboratories, employed a 10 MeV carbon microbeam with 1{mu}m diameter spot to scan test structures on specifically designed ICs. With the aid of IC layout information, an analysis of the charge collection efficiency from different test areas is presented.

  20. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players

    PubMed Central

    Papoti, M; Da Silva, ASR; Barbieri, RA; Campos, EZ; Ferreira, EC; Loures, JP; Chamari, K

    2016-01-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1, lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L-1: 9.5±1.2 and 8.1±1.0 km∙h-1; 3.5 mmol∙L-1: 12.0±1.2 and 10.2±1.1 km∙h-1; Dmax: 11.4±1.4 and 9.3±0.4 km∙h-1; peak lactate: 14.9±1.6 and 10.9±0.8 km∙h-1). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1 and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players. PMID:27601781

  1. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players.

    PubMed

    Zagatto, A M; Papoti, M; Da Silva, Asr; Barbieri, R A; Campos, E Z; Ferreira, E C; Loures, J P; Chamari, K

    2016-09-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1), lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L(-1): 9.5±1.2 and 8.1±1.0 km∙h(-1); 3.5 mmol∙L(-1): 12.0±1.2 and 10.2±1.1 km∙h(-1); Dmax: 11.4±1.4 and 9.3±0.4 km∙h(-1); peak lactate: 14.9±1.6 and 10.9±0.8 km∙h(-1)). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1) and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players. PMID:27601781

  2. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players.

    PubMed

    Zagatto, A M; Papoti, M; Da Silva, Asr; Barbieri, R A; Campos, E Z; Ferreira, E C; Loures, J P; Chamari, K

    2016-09-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1), lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L(-1): 9.5±1.2 and 8.1±1.0 km∙h(-1); 3.5 mmol∙L(-1): 12.0±1.2 and 10.2±1.1 km∙h(-1); Dmax: 11.4±1.4 and 9.3±0.4 km∙h(-1); peak lactate: 14.9±1.6 and 10.9±0.8 km∙h(-1)). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1) and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players.

  3. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players

    PubMed Central

    Papoti, M; Da Silva, ASR; Barbieri, RA; Campos, EZ; Ferreira, EC; Loures, JP; Chamari, K

    2016-01-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1, lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L-1: 9.5±1.2 and 8.1±1.0 km∙h-1; 3.5 mmol∙L-1: 12.0±1.2 and 10.2±1.1 km∙h-1; Dmax: 11.4±1.4 and 9.3±0.4 km∙h-1; peak lactate: 14.9±1.6 and 10.9±0.8 km∙h-1). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L-1, 3.5 mmol∙L-1 and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players.

  4. Development and Test of a Prototype 100MVA Superconducting Generator

    SciTech Connect

    Fogarty, James M.; Bray, James W.

    2007-05-25

    In 2002, General Electric and the US Department of Energy (DOE) entered into a cooperative agreement for the development of a commercialized 100 MVA generator using high temperature superconductors (HTS) in the field winding. The intent of the program was to: • Identify and develop technologies that would be needed for such a generator. • Develop conceptual designs for generators with ratings of 100 MVA and higher using HTS technology. • Perform proof of concept tests at the 1.5 MW level for GE’s proprietary warm iron rotor HTS generator concept. • Design, build, and test a prototype of a commercially viable 100 MVA generator that could be placed on the power grid. This report summarizes work performed during the program and is provided as one of the final program deliverables.

  5. Long term tests of a SNAP-19 thermoelectric generator.

    NASA Technical Reports Server (NTRS)

    Rouklove, P.; Truscello, V.

    1972-01-01

    Results of tests performed on a SNAP 19 thermoelectric generator, SN-20. The SN-20 generator was tested for approximately 37,000 hours using electrical heating to simulate the heat released by isotope decay. After 27,000 hours of operation the output power from the generator decreased to approximately 1/3 of the beginning of life value while the internal resistance increased by a factor of 5. Analysis of the test results, confirmed by preliminary metallographic examination, indicated that the output power degradation was the result of excessive sublimation of the thermoelectric material and loss of the hot junction bond due to the depletion of the internal cover gas. This also resulted in excessive junction temperatures. Comparison is made with the behavior observed from the two flight generators and a tentative conclusion is advanced as to the reason for their failure.

  6. Running Tests of a Combined SC Type Linear Generator

    NASA Astrophysics Data System (ADS)

    Hasegawa, Hitoshi; Murai, Toshiaki; Yamamoto, Takamitsu

    In the superconducting maglev system, it is important to develop a non-contact on-board power source without environmental pollution such as noise and exhaust gas. We have studied a combined SC (Superconducting Coil) type linear generator as the most realistic system. The linear generator system has improved to increase output, power factor and measuring equipment. In this paper, the linear generator system is experimented in running tests on the Yamanashi Test line. We can supply power of 25kW to half a car in the speed range 400km/h to 500km/h. A good correlation is recognized between the analysis and measurement in the running tests. This linear generator system can be expected to be applicable in the practical use

  7. A Test Generation Framework for Distributed Fault-Tolerant Algorithms

    NASA Technical Reports Server (NTRS)

    Goodloe, Alwyn; Bushnell, David; Miner, Paul; Pasareanu, Corina S.

    2009-01-01

    Heavyweight formal methods such as theorem proving have been successfully applied to the analysis of safety critical fault-tolerant systems. Typically, the models and proofs performed during such analysis do not inform the testing process of actual implementations. We propose a framework for generating test vectors from specifications written in the Prototype Verification System (PVS). The methodology uses a translator to produce a Java prototype from a PVS specification. Symbolic (Java) PathFinder is then employed to generate a collection of test cases. A small example is employed to illustrate how the framework can be used in practice.

  8. Results of closed cycle MHD power generation test with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross sectional dimensions of the MHD channel in the NASA Lewis closed loop facility were reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 160,000 n/M2, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/M. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/M were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/M3 were obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those previously reported for the M = 0.2 channel.

  9. Results of closed cycle MHD power generation tests with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross-sectional dimensions of the MHD channel in the NASA Lewis closed loop facility have been reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 1.6 x 10 to the 5th N/sq m, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/m. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/m were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/cu m have been obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those reported for the m = 0.2 channel at the last EAM Symposium.

  10. Modeling a Printed Circuit Heat Exchanger with RELAP5-3D for the Next Generation Nuclear Plant

    SciTech Connect

    Not Available

    2010-12-01

    The main purpose of this report is to design a printed circuit heat exchanger (PCHE) for the Next Generation Nuclear Plant and carry out Loss of Coolant Accident (LOCA) simulation using RELAP5-3D. Helium was chosen as the coolant in the primary and secondary sides of the heat exchanger. The design of PCHE is critical for the LOCA simulations. For purposes of simplicity, a straight channel configuration was assumed. A parallel intermediate heat exchanger configuration was assumed for the RELAP5 model design. The RELAP5 modeling also required the semicircular channels in the heat exchanger to be mapped to rectangular channels. The initial RELAP5 run outputs steady state conditions which were then compared to the heat exchanger performance theory to ensure accurate design is being simulated. An exponential loss of pressure transient was simulated. This LOCA describes a loss of coolant pressure in the primary side over a 20 second time period. The results for the simulation indicate that heat is initially transferred from the primary loop to the secondary loop, but after the loss of pressure occurs, heat transfers from the secondary loop to the primary loop.

  11. Test facility of thermal storage equipment for space power generation

    NASA Astrophysics Data System (ADS)

    Inoue, T.; Nakagawa, M.; Mochida, Y.; Ohtomo, F.; Shimizu, K.; Tanaka, K.; Abe, Y.; Nomura, O.; Kamimoto, M.

    A thermal storage equipment test facility has been built in connection with developing solar dynamic power systems (SDPSs). The test facility consists of a recuperative closed Brayton cycle system (CBC), with a mixture of helium and xenon with a molecular weight of 39.9 serving as the working fluid. CBC has been shown to be the most attractive power generation system among several types of SDPSs because of its ability to meet the required high power demand and its thermal efficiency, about 30 percent. The authors present a description of this test facility and give results of the preliminary test and the first-stage test with heat storage equipment.

  12. A 4 V, ns-range pulse generator for the test of Cherenkov Telescopes readout electronics

    NASA Astrophysics Data System (ADS)

    Antoranz, P.; Vegas, I.; Miranda, J. M.

    2010-08-01

    We present in this paper the design, fabrication and verification of a ns-range pulse generator based on a Step Recovery Diode (SRD). This device needs only a 5 V DC power supply, delivers 1 ns pulses with peak amplitudes in excess of 4 V and features state of the art jitter figures. In addition, the pulser contains a trigger channel. The long standing problem of the SRD simulation via circuital analysis is addressed. It is shown that the dynamic properties of the Step Recovery Diode can accurately be reproduced via a small signal circuital simulation for the rise times needed in a ns-range pulser. It is also demonstrated that strong inaccuracies in the pulse shape prediction are obtained if the wave propagation through the lines typically used in this type of circuits is simulated by a simple Transverse Electromagnetic Mode (TEM) line model. Instead, it is necessary to account for non-TEM effects. By means of broadband resistive power splitters and high dynamic range amplifiers, a prototype of 4 channels was also fabricated. This prototype is particularly useful for testing the readout electronics of Cherenkov Telescopes, but additional applications to other large-scale experiments are expected, any of those where calibration or verification with compact ns-range pulsers featuring low jitter, large dynamic ranges and multichannel operation is needed. In addition, the fabrication cost of this pulser is almost negligible as compared with bulky, commercially available waveform generators, which rarely deliver ns pulses in excess of 3 V. Furthermore, the small size of the pulser presented here and its low power consumption allow an easy integration into more complex systems.

  13. Hidden circuits and argumentation

    NASA Astrophysics Data System (ADS)

    Leinonen, Risto; Kesonen, Mikko H. P.; Hirvonen, Pekka E.

    2016-11-01

    Despite the relevance of DC circuits in everyday life and schools, they have been shown to cause numerous learning difficulties at various school levels. In the course of this article, we present a flexible method for teaching DC circuits at lower secondary level. The method is labelled as hidden circuits, and the essential idea underlying hidden circuits is in hiding the actual wiring of DC circuits, but to make their behaviour evident for pupils. Pupils are expected to find out the wiring of the circuit which should enhance their learning of DC circuits. We present two possible ways to utilise hidden circuits in a classroom. First, they can be used to test and enhance pupils’ conceptual understanding when pupils are expected to find out which one of the offered circuit diagram options corresponds to the actual circuit shown. This method aims to get pupils to evaluate the circuits holistically rather than locally, and as a part of that aim this method highlights any learning difficulties of pupils. Second, hidden circuits can be used to enhance pupils’ argumentation skills with the aid of argumentation sheet that illustrates the main elements of an argument. Based on the findings from our co-operating teachers and our own experiences, hidden circuits offer a flexible and motivating way to supplement teaching of DC circuits.

  14. Automated Generation and Assessment of Autonomous Systems Test Cases

    NASA Technical Reports Server (NTRS)

    Barltrop, Kevin J.; Friberg, Kenneth H.; Horvath, Gregory A.

    2008-01-01

    This slide presentation reviews some of the issues concerning verification and validation testing of autonomous spacecraft routinely culminates in the exploration of anomalous or faulted mission-like scenarios using the work involved during the Dawn mission's tests as examples. Prioritizing which scenarios to develop usually comes down to focusing on the most vulnerable areas and ensuring the best return on investment of test time. Rules-of-thumb strategies often come into play, such as injecting applicable anomalies prior to, during, and after system state changes; or, creating cases that ensure good safety-net algorithm coverage. Although experience and judgment in test selection can lead to high levels of confidence about the majority of a system's autonomy, it's likely that important test cases are overlooked. One method to fill in potential test coverage gaps is to automatically generate and execute test cases using algorithms that ensure desirable properties about the coverage. For example, generate cases for all possible fault monitors, and across all state change boundaries. Of course, the scope of coverage is determined by the test environment capabilities, where a faster-than-real-time, high-fidelity, software-only simulation would allow the broadest coverage. Even real-time systems that can be replicated and run in parallel, and that have reliable set-up and operations features provide an excellent resource for automated testing. Making detailed predictions for the outcome of such tests can be difficult, and when algorithmic means are employed to produce hundreds or even thousands of cases, generating predicts individually is impractical, and generating predicts with tools requires executable models of the design and environment that themselves require a complete test program. Therefore, evaluating the results of large number of mission scenario tests poses special challenges. A good approach to address this problem is to automatically score the results

  15. Gas Generation from K East Basin Sludges - Series II Testing

    SciTech Connect

    Bryan, Samuel A.; Delegard, Calvin H.; Schmidt, Andrew J.; Sell, Rachel L.; Silvers, Kurt L.; Gano, Susan R.; Thornton, Brenda M.

    2001-03-14

    This report describes work to examine the gas generation behavior of actual K East (KE) Basin floor, pit and canister sludge. Mixed and unmixed and fractionated KE canister sludge were tested, along with floor and pit sludges from areas in the KE Basin not previously sampled. The first report in this series focused on gas generation from KE floor and canister sludge collected using a consolidated sampling technique. The third report will present results of gas generation testing of irradiated uranium fuel fragments with and without sludge addition. The path forward for management of the K Basin Sludge is to retrieve, ship, and store the sludge at T Plant until final processing at some future date. Gas generation will impact the designs and costs of systems associated with retrieval, transportation and storage of sludge.

  16. Micro-power generator supplying source for integrated circuit chip based on Pb(Sn,Zr,Ti)O3 ferroelectric ceramic

    NASA Astrophysics Data System (ADS)

    Zhang, Zhenhai; Cui, Zhanzhong; Yan, Jinglong; Li, Kejie

    2011-04-01

    We have demonstrated both experimentally and theoretically that a tin-modified and niobium-modified lead zirconate titanate (Pb(Sn,Zr,Ti)O3) ferroelectric generator system can function as a micro-power supplying source for integrated circuit (IC) chip of separate nonelectric impulse input shock tube digital delay detonator. The ferroelectric ceramic phase transition under transverse shock wave compression can charge an external storage capacitor. The ferroelectric ceramic micro-pulsed-power system is capable of generating low output voltage pulses with an amplitude of 54.2 V and with transferred energy of 1.73 mJ, ultimately supplying an IC chip with micro-power. This work presents the methodology for theoretical analysis and experimental operation of the ferroelectric generator. Theoretical calculations are conducted based on circuit analysis law and principles of dynamic high pressure and shock wave physics. The experimental results were in good agreement with the theoretical analysis.

  17. Rational design of modular circuits for gene transcription: A test of the bottom-up approach

    PubMed Central

    2010-01-01

    Background Most of synthetic circuits developed so far have been designed by an ad hoc approach, using a small number of components (i.e. LacI, TetR) and a trial and error strategy. We are at the point where an increasing number of modular, inter-changeable and well-characterized components is needed to expand the construction of synthetic devices and to allow a rational approach to the design. Results We used interchangeable modular biological parts to create a set of novel synthetic devices for controlling gene transcription, and we developed a mathematical model of the modular circuits. Model parameters were identified by experimental measurements from a subset of modular combinations. The model revealed an unexpected feature of the lactose repressor system, i.e. a residual binding affinity for the operator site by induced lactose repressor molecules. Once this residual affinity was taken into account, the model properly reproduced the experimental data from the training set. The parameters identified in the training set allowed the prediction of the behavior of networks not included in the identification procedure. Conclusions This study provides new quantitative evidences that the use of independent and well-characterized biological parts and mathematical modeling, what is called a bottom-up approach to the construction of gene networks, can allow the design of new and different devices re-using the same modular parts. PMID:21070658

  18. NASA Fastrac Engine Gas Generator Component Test Program and Results

    NASA Technical Reports Server (NTRS)

    Dennis, Henry J., Jr.; Sanders, Tim; Turner, James E. (Technical Monitor)

    2000-01-01

    This presentation consists of viewgraph which review the test program and the results of the tests for the Gas Generator (GG) component for the Fastrac Engine. Included are pictures of the Fastrac (MC-1) Engine and the GG, diagrams of the flight configuration, and schematics of the LOX, and the RP-1 systems and the injector assembly. The normal operating parameters are reviewed, as are the test instrumentation. Also shown are graphs of the hot gas temperature, and the test temperature profiles. The results are summarized.

  19. Generating realistic environments for cyber operations development, testing, and training

    NASA Astrophysics Data System (ADS)

    Berk, Vincent H.; Gregorio-de Souza, Ian; Murphy, John P.

    2012-06-01

    Training eective cyber operatives requires realistic network environments that incorporate the structural and social complexities representative of the real world. Network trac generators facilitate repeatable experiments for the development, training and testing of cyber operations. However, current network trac generators, ranging from simple load testers to complex frameworks, fail to capture the realism inherent in actual environments. In order to improve the realism of network trac generated by these systems, it is necessary to quantitatively measure the level of realism in generated trac with respect to the environment being mimicked. We categorize realism measures into statistical, content, and behavioral measurements, and propose various metrics that can be applied at each level to indicate how eectively the generated trac mimics the real world.

  20. Generating Reduced Tests for FSMs with Extra States

    NASA Astrophysics Data System (ADS)

    Simão, Adenilso; Petrenko, Alexandre; Yevtushenko, Nina

    We address the problem of generating tests from a deterministic Finite State Machine to provide full fault coverage even if the faults may introduce extra states in the implementations. It is well-known that such tests should include the sequences in the so-called traversal set, which contains all sequences of length defined by the number of extra states. Therefore, the only apparent opportunity to produce shorter tests is to find within a test suite a suitable arrangement of the sequences in the inescapable traversal set. We observe that the direct concatenation of the traversal set to a given state cover, suggested by all existing generation methods with full fault coverage, results in extensive test branching, when a test has to be repeatedly executed to apply all the sequences of the traversal set. In this paper, we state conditions which allow distributing these sequences over several tests. We then utilize these conditions to elaborate a method, called SPY-method, which shortens tests by avoiding test branching as much as possible. We present the results of the experimental comparison of the proposed method with an existing method which indicate that the resulting save can be up to 40%.

  1. Techniques for control of long-term reliability of complex integrated circuits. I - Reliability assurance by test vehicle qualification.

    NASA Technical Reports Server (NTRS)

    Van Vonno, N. W.

    1972-01-01

    Development of an alternate approach to the conventional methods of reliability assurance for large-scale integrated circuits. The product treated is a large-scale T squared L array designed for space applications. The concept used is that of qualification of product by evaluation of the basic processing used in fabricating the product, providing an insight into its potential reliability. Test vehicles are described which enable evaluation of device characteristics, surface condition, and various parameters of the two-level metallization system used. Evaluation of these test vehicles is performed on a lot qualification basis, with the lot consisting of one wafer. Assembled test vehicles are evaluated by high temperature stress at 300 C for short time durations. Stressing at these temperatures provides a rapid method of evaluation and permits a go/no go decision to be made on the wafer lot in a timely fashion.

  2. Prototype steam generator test at SCTI/ETEC. Acoustic program test plan. [LMFBR

    SciTech Connect

    Greene, D.A.; Thiele, A.; Claytor, T.N.

    1981-10-01

    This document is an integrated test plan covering programs at General Electric (ARSD), Rockwell International (RI) and Argonne National Laboratory (CT). It provides an overview of the acoustic leak detection test program which will be completed in conjunction with the prototype LMFBR steam generator at the Energy Technology Engineering Laboratory. The steam generator is installed in the Sodium Components Test Installation (SCTI). Two acoustic detection systems will be used during the test program, a low frequency system developed by GE-ARSD (GAAD system) and a high frequency system developed by RI-AI (HALD system). These systems will be used to acquire data on background noise during the thermal-hydraulic test program. Injection devices were installed during fabrication of the prototype steam generator to provide localized noise sources in the active region of the tube bundle. These injectors will be operated during the steam generator test program, and it will be shown that they are detected by the acoustic systems.

  3. Experiments with Test Case Generation and Runtime Analysis

    NASA Technical Reports Server (NTRS)

    Artho, Cyrille; Drusinsky, Doron; Goldberg, Allen; Havelund, Klaus; Lowry, Mike; Pasareanu, Corina; Rosu, Grigore; Visser, Willem; Koga, Dennis (Technical Monitor)

    2003-01-01

    Software testing is typically an ad hoc process where human testers manually write many test inputs and expected test results, perhaps automating their execution in a regression suite. This process is cumbersome and costly. This paper reports preliminary results on an approach to further automate this process. The approach consists of combining automated test case generation based on systematically exploring the program's input domain, with runtime analysis, where execution traces are monitored and verified against temporal logic specifications, or analyzed using advanced algorithms for detecting concurrency errors such as data races and deadlocks. The approach suggests to generate specifications dynamically per input instance rather than statically once-and-for-all. The paper describes experiments with variants of this approach in the context of two examples, a planetary rover controller and a space craft fault protection system.

  4. Next Generation Advanced Video Guidance Sensor Development and Test

    NASA Technical Reports Server (NTRS)

    Howard, Richard T.; Bryan, Thomas C.; Lee, Jimmy; Robertson, Bryan

    2009-01-01

    The Advanced Video Guidance Sensor (AVGS) was the primary docking sensor for the Orbital Express mission. The sensor performed extremely well during the mission, and the technology has been proven on orbit in other flights too. Parts obsolescence issues prevented the construction of more AVGS units, so the next generation of sensor was designed with current parts and updated to support future programs. The Next Generation Advanced Video Guidance Sensor (NGAVGS) has been tested as a breadboard, two different brassboard units, and a prototype. The testing revealed further improvements that could be made and demonstrated capability beyond that ever demonstrated by the sensor on orbit. This paper presents some of the sensor history, parts obsolescence issues, radiation concerns, and software improvements to the NGAVGS. In addition, some of the testing and test results are presented. The NGAVGS has shown that it will meet the general requirements for any space proximity operations or docking need.

  5. Method and Apparatus for Testing Microwave Devices and Circuits in a Controlled Environment

    NASA Technical Reports Server (NTRS)

    Miranda, Felix A. (Inventor); Toncich, Stanley S. (Inventor)

    1998-01-01

    A test system is disclosed that enables the testing of microwave components in a controlled environment without disturbing that environment. The system includes a test fixture which holds the calibration standards and the component being tested, and environmental control chamber, and a microwave switching system. The system provides a coaxial connection to microwave testing equipment, such as an automatic network analyzer (ANA) and facilitates both calibration and testing while maintaining environmental integrity.

  6. Benzene Generation Testing for Tank 48H Waste Disposition

    SciTech Connect

    Peters, T

    2005-05-13

    In support for the Aggregation option1, researchers performed a series of tests using actual Tank 48H slurries. The tests were designed to examine potential benzene generation issues if the Tank 48H slurry is disposed to Saltstone. Personnel used the archived Tank 48H sample (HTF-E-03-127, collected September 17, 2003) for the experiments. The tests included a series of three experiments (Tests A, B, and F) performed in duplicate, giving a total of six experiments. Test A used Tank 48H slurry mixed with {approx}20:1 with Defense Waste Processing Facility (DWPF) Recycle from Tanks 21H and 22H. Test B used Tank 48H slurry mixed with {approx}2.7:1 with DWPF Recycle from Tanks 21H and 22H, while Test F used Tank 48H slurry as-is. Tests A and B occurred at 45 C, while Test F occurred at 55 C. Over a period of 8 weeks, personnel collected samples for analysis, once per week. Each sample was tested with the in-cell gamma counter. The researchers noted a decline in the cesium activity in solution which is attributed to temperature dependence of the complex slurry equilibrium. Selected samples were sent to ADS for potassium, boron, and cesium analysis. The benzene generation rate was inferred from the TPB destruction which is indirectly measured by the in-growth of cesium, potassium or boron. The results of all the analyses reveal no discernible in-growth of radiocesium, potassium or boron, indicating no significant tetraphenylborate (TPB) decomposition in any of the experiments. From boron measurements, the inferred rate of TPB destruction remained less than 0.332 mg/(L-h) implying a maximum benzene generation rate of <0.325 mg/(L-h).

  7. Optoelectronic cross-injection locking of a dual-wavelength photonic integrated circuit for low-phase-noise millimeter-wave generation.

    PubMed

    Kervella, Gaël; Van Dijk, Frederic; Pillet, Grégoire; Lamponi, Marco; Chtioui, Mourad; Morvan, Loïc; Alouini, Mehdi

    2015-08-01

    We report on the stabilization of a 90-GHz millimeter-wave signal generated from a fully integrated photonic circuit. The chip consists of two DFB single-mode lasers whose optical signals are combined on a fast photodiode to generate a largely tunable heterodyne beat note. We generate an optical comb from each laser with a microwave synthesizer, and by self-injecting the resulting signal, we mutually correlate the phase noise of each DFB and stabilize the beatnote on a multiple of the frequency delivered by the synthesizer. The performances achieved beat note linewidth below 30 Hz.

  8. Tuning of superconducting nanowire single-photon detector parameters for VLSI circuit testing using time-resolved emission

    NASA Astrophysics Data System (ADS)

    Bahgat Shehata, A.; Stellari, F.

    2015-01-01

    Time-Resolved Emission (TRE) is a truly non-invasive technique based on the detection of intrinsic light emitted by integrated circuits that is used for the detection of timing related faults from the backside of flip-chip VLSI circuits. Single-photon detectors with extended sensitivity in the Near Infrared (NIR) are used to perform time-correlated single-photon counting measurements and retrieve the temporal distribution of the emitted photons, thus identifying gates switching events. The noise, efficiency and jitter performance of the detector are crucial to enable ultra-low voltage waveform sensitivity. For this reason, cryogenically cooled Superconducting Nanowire Single-Photon Detectors (SNSPDs) offer superior performance compared to state-of-the-art Single-Photon Avalanche Diodes (SPADs). In this paper we will discuss how detector front-end electronics parameters, such as bias current, RF attenuation and comparator threshold, can be tailored to optimize the measurement Signal-to-Noise Ratio (SNR), defined as the ratio between the switching emission peak amplitude and the standard deviation of the noise in the time interval in which there are no photons emitted from the circuit. For example, reducing the attenuation and the threshold of the comparator used to detect switching events may lead to an improvement of the jitter, due to the better discrimination of the detector firing, but also a higher sensitivity to external electric noise disturbances. Similarly, by increasing the bias current, both the detection efficiency and the jitter improve, but the noise increases as well. For these reasons an optimization of the SNR is necessary. For this work, TRE waveforms were acquired from a 32 nm Silicon On Insulator (SOI) chip operating down to 0.4 V using different generations of SNSPD systems.

  9. Testing and Functions of the J2X Gas Generator

    NASA Technical Reports Server (NTRS)

    Miller, Nicholas

    2009-01-01

    The Ares I, NASA s new solid rocket based crew launch vehicle, is a two stage in line rocket that has made its waytothe forefront of NASA s endeavors. The Ares I s Upper Stage (US) will be propelled by a J-2X engine which is fueled by liquid hydrogen and liquid oxygen. The J-2X is a variation based on two of its predecessor s, the J-2 and J-2S engines. ET50 is providing the design support for hardware required to run tests on the J-2X Gas Generator (GG) that increases the delivery pressure of the supplied combustion fuels that the engine burns. The test area will be running a series of tests using different lengths and curved segments of pipe and different sized nozzles to determine the configuration that best satisfies the thrust, heat, and stability requirements for the engine. I have had to research the configurations that are being tested and gain an understanding of the purpose of the tests. I then had to research the parts that would be used in the test configurations. I was taken to see parts similar to the ones used in the test configurations and was allowed to review drawings and dimensions used for those parts. My job over this summer has been to use the knowledge I have gained to design, model, and create drawings for the un-fabricated parts that are necessary for the J-2X Workhorse Gas Generator Phase IIcTest.

  10. Pattern Generator for Bench Test of Digital Boards

    NASA Technical Reports Server (NTRS)

    Berkun, Andrew C.; Chu, Anhua J.

    2012-01-01

    All efforts to develop electronic equipment reach a stage where they need a board test station for each board. The SMAP digital system consists of three board types that interact with each other using interfaces with critical timing. Each board needs to be tested individually before combining into the integrated digital electronics system. Each board needs critical timing signals from the others to be able to operate. A bench test system was developed to support test of each board. The test system produces all the outputs of the control and timing unit, and is delivered much earlier than the timing unit. Timing signals are treated as data. A large file is generated containing the state of every timing signal at any instant. This file is streamed out to an IO card, which is wired directly to the device-under-test (DUT) input pins. This provides a flexible test environment that can be adapted to any of the boards required to test in a standalone configuration. The problem of generating the critical timing signals is then transferred from a hardware problem to a software problem where it is more easily dealt with.

  11. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  12. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  13. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  14. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  15. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages §...

  16. Electronic test instrument generates extremely small current signals

    NASA Technical Reports Server (NTRS)

    Brookshier, W. K.

    1967-01-01

    Generator produces dynamic test signals in the range from 0.0001 and 10 to the minus 12th power amperes. It involves an extension of the technique of applying a triangular voltage waveform to a small capacitor to obtain a square-wave output current. The effects of stray capacitance are minimized by appropriate shielding.

  17. Automatic Generation of Tests from Domain and Multimedia Ontologies

    ERIC Educational Resources Information Center

    Papasalouros, Andreas; Kotis, Konstantinos; Kanaris, Konstantinos

    2011-01-01

    The aim of this article is to present an approach for generating tests in an automatic way. Although other methods have been already reported in the literature, the proposed approach is based on ontologies, representing both domain and multimedia knowledge. The article also reports on a prototype implementation of this approach, which…

  18. Thermohydraulic testing of a helium heated steam-generator

    SciTech Connect

    Bezlepkin, V.V.; Korotayev, O.I.; Simkin, B.P.; Fedorovich, Y.D.; Mizonov, N.V.

    1990-01-01

    This paper presents an analysis of the results of testing an experimental steam-generator. The reasons for the deviation of the characteristics of the section from the predicted values are revealed. The results of an investigation into the gasdynamics of the inlet chamber of the experimental section are presented.

  19. Extended Aging of Ag/W Circuit Breaker Contacts: Influence on Surface Structure, Electrical Properties, and UL Testing Performance

    NASA Astrophysics Data System (ADS)

    Yu, Haibo; Kesim, M. Tumerkan; Sun, Yu; Harmon, Jason; Potter, Jonathan; Alpay, S. Pamir; Aindow, Mark

    2016-01-01

    Samples of 120 V, 30 A commercial circuit breakers were subjected to various aging treatments and the resulting microstructures at the surfaces of the Ag/W contacts were studied using a combination of x-ray diffraction, scanning electron microscopy, and energy-dispersive x-ray spectroscopy techniques. Breakers aged naturally in a hot, humid climate were compared to those subjected to accelerated aging in dry and humid environments. The most extensive oxidation was observed for contacts from breakers subjected to accelerated humid aging; these contacts exhibited thick surface layers consisting of Ag2O, Ag2WO4, Cu(OH)2•H2O, and WO3 phases. Far less surface degradation was observed for dry-aged contacts. Naturally aged contacts showed variations in degradation with more oxidation at the surface regions outside the physical contact area on the contact face. A correlation was found between the contact resistances measured from these samples following ASTM standard B 667-97 and the observed surface microstructures. To evaluate the effects of the surface oxides on breaker performance, humid-aged breakers were subjected to standardized UL overload/temperature-rise, endurance, and short-circuit testing following UL489. The contacts in these breakers exhibit similar microstructural and property changes to those observed previously for as-manufactured contacts after UL testing. These data illustrate the robust performance of this contact technology even after being subjected to aggressive artificial aging.

  20. Radioisotope thermoelectric generator licensed hardware package and certification tests

    NASA Astrophysics Data System (ADS)

    Goldmann, Louis H.; Averette, Henry S.

    1995-01-01

    This paper presents the Licensed Hardware package and the Certification Test portions of the Radioisitope Themoelectric Generator Transportation System. This package has been designed to meet those portions of the Code of Federal Regulations (10 CFR 71) relating to ``Type B'' shipments of radioactive materials. The licensed hardware is now in the U. S. Department of Energy licensing process that certifies the packaging's integrity under accident conditions. The detailed information for the anticipated license is presented in the safety analysis report for packaging, which is now in process and undergoing necessary reviews. As part of the licensing process, a full-size Certification Test Article unit, which has modifications slightly different than the Licensed Hardware or production shipping units, is used for testing. Dimensional checks of the Certification Test Article were made at the manufacturing facility. Leak testing and drop testing were done at the 300 Area of the U.S. Department of Energy's Hanford Site near Richland, Washington. The hardware includes independent double containments to prevent the environmental spread of 238Pu, impact limiting devices to protect portions of the package from impacts, and thermal insulation to protect the seal areas from excess heat during accident conditions. The package also features electronic feed-throughs to monitor the Radioisotope Thermoelectric Generator's temperature inside the containment during the shipment cycle. This package is designed to safely dissipate the typical 4,500 thermal watts produced in the largest Radioisotope Thermoelectric Generators. The package also contains provisions to ensure leak tightness when radioactive materials, such as a Radioisotope Thermoelectric Generator for the Cassini Mission, planned for 1997 by the National Aeronautics and Space Administration, are being prepared for shipment. These provisions include test ports used in conjunction with helium mass spectrometers to determine

  1. Radioisotope thermoelectric generator licensed hardware package and certification tests

    NASA Astrophysics Data System (ADS)

    Goldmann, L. H.; Averette, H. S.

    1994-09-01

    This paper presents the Licensed Hardware package and the Certification Test portions of the Radioisotope Thermoelectric Generator Transportation System. This package has been designed to meet those portions of the Code of Federal Regulations (10 CFR 71) relating to 'Type B' shipments of radioactive materials. The detailed information for the anticipated license is presented in the safety analysis report for packaging, which is now in process and undergoing necessary reviews. As part of the licensing process, a full-size Certification Test Article unit, which has modifications slightly different than the Licensed Hardware or production shipping units, is used for testing. Dimensional checks of the Certification Test Article were made at the manufacturing facility. Leak testing and drop testing were done at the 300 Area of the US Department of Energy's Hanford Site near Richland, Washington. The hardware includes independent double containments to prevent the environmental spread of Pu-238, impact limiting devices to protect portions of the package from impacts, and thermal insulation to protect the seal areas from excess heat during accident conditions. The package also features electronic feed-throughs to monitor the Radioisotope Thermoelectric Generator's temperature inside the containment during the shipment cycle. This package is designed to safely dissipate the typical 4500 thermal watts produced in the largest Radioisotope Thermoelectric Generators. The package also contains provisions to ensure leak tightness when radioactive materials, such as a Radioisotope Thermoelectric Generator for the Cassini Mission, planned for 1997 by the National Aeronautics and Space Administration, are being prepared for shipment. These provisions include test ports used in conjunction with helium mass spectrometers to determine seal leakage rates of each containment during the assembly process.

  2. Simulation of TunneLadder traveling-wave tube cold-test characteristics: Implementation of the three-dimensional, electromagnetic circuit analysis code micro-SOS

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Wilson, Jeffrey D.

    1993-01-01

    The three-dimensional, electromagnetic circuit analysis code, Micro-SOS, can be used to reduce expensive time-consuming experimental 'cold-testing' of traveling-wave tube (TWT) circuits. The frequency-phase dispersion characteristics and beam interaction impedance of a TunneLadder traveling-wave tube slow-wave structure were simulated using the code. When reasonable dimensional adjustments are made, computer results agree closely with experimental data. Modifications to the circuit geometry that would make the TunneLadder TWT easier to fabricate for higher frequency operation are explored.

  3. Automated Test Case Generation for an Autopilot Requirement Prototype

    NASA Technical Reports Server (NTRS)

    Giannakopoulou, Dimitra; Rungta, Neha; Feary, Michael

    2011-01-01

    Designing safety-critical automation with robust human interaction is a difficult task that is susceptible to a number of known Human-Automation Interaction (HAI) vulnerabilities. It is therefore essential to develop automated tools that provide support both in the design and rapid evaluation of such automation. The Automation Design and Evaluation Prototyping Toolset (ADEPT) enables the rapid development of an executable specification for automation behavior and user interaction. ADEPT supports a number of analysis capabilities, thus enabling the detection of HAI vulnerabilities early in the design process, when modifications are less costly. In this paper, we advocate the introduction of a new capability to model-based prototyping tools such as ADEPT. The new capability is based on symbolic execution that allows us to automatically generate quality test suites based on the system design. Symbolic execution is used to generate both user input and test oracles user input drives the testing of the system implementation, and test oracles ensure that the system behaves as designed. We present early results in the context of a component in the Autopilot system modeled in ADEPT, and discuss the challenges of test case generation in the HAI domain.

  4. Thermal Analysis and Testing of Fastrac Gas Generator Design

    NASA Technical Reports Server (NTRS)

    Nguyen, H.

    1998-01-01

    The Fastrac Engine is being developed by the Marshall Space Flight Center (MSFC) to help meet the goal of substantially reducing the cost of access to space. This engine relies on a simple gas-generator cycle, which burns a small amount of RP-1 and oxygen to provide gas to drive the turbine and then exhausts the spent fuel. The Fastrac program envisions a combination of analysis, design and hot-fire evaluation testing. This paper provides the supporting thermal analysis of the gas generator design. In order to ensure that the design objectives were met, the evaluation tests have started on a component level and a total of 15 tests of different durations were completed to date at MSFC. The correlated thermal model results will also be compared against hot-fire thermocouple data gathered.

  5. Improved ant algorithms for software testing cases generation.

    PubMed

    Yang, Shunkun; Man, Tianlong; Xu, Jiaqi

    2014-01-01

    Existing ant colony optimization (ACO) for software testing cases generation is a very popular domain in software testing engineering. However, the traditional ACO has flaws, as early search pheromone is relatively scarce, search efficiency is low, search model is too simple, positive feedback mechanism is easy to produce the phenomenon of stagnation and precocity. This paper introduces improved ACO for software testing cases generation: improved local pheromone update strategy for ant colony optimization, improved pheromone volatilization coefficient for ant colony optimization (IPVACO), and improved the global path pheromone update strategy for ant colony optimization (IGPACO). At last, we put forward a comprehensive improved ant colony optimization (ACIACO), which is based on all the above three methods. The proposed technique will be compared with random algorithm (RND) and genetic algorithm (GA) in terms of both efficiency and coverage. The results indicate that the improved method can effectively improve the search efficiency, restrain precocity, promote case coverage, and reduce the number of iterations.

  6. Improved Ant Algorithms for Software Testing Cases Generation

    PubMed Central

    Yang, Shunkun; Xu, Jiaqi

    2014-01-01

    Existing ant colony optimization (ACO) for software testing cases generation is a very popular domain in software testing engineering. However, the traditional ACO has flaws, as early search pheromone is relatively scarce, search efficiency is low, search model is too simple, positive feedback mechanism is easy to porduce the phenomenon of stagnation and precocity. This paper introduces improved ACO for software testing cases generation: improved local pheromone update strategy for ant colony optimization, improved pheromone volatilization coefficient for ant colony optimization (IPVACO), and improved the global path pheromone update strategy for ant colony optimization (IGPACO). At last, we put forward a comprehensive improved ant colony optimization (ACIACO), which is based on all the above three methods. The proposed technique will be compared with random algorithm (RND) and genetic algorithm (GA) in terms of both efficiency and coverage. The results indicate that the improved method can effectively improve the search efficiency, restrain precocity, promote case coverage, and reduce the number of iterations. PMID:24883391

  7. Power management circuit for resonant energy harvesters

    NASA Astrophysics Data System (ADS)

    Jirku, Tomas; Steinbauer, Miloslav; Kluge, Martin

    2009-05-01

    This paper deals with the design of the power management circuit for the vibration generator developed in the frame of the European WISE project and its testing in the connection with the generator and the dynamic load simulating the real load. This generator is used as an autonomous energy source for wireless sensor applications. It can be used for example in the aeronautic, automotive and many other applications. The generator output power analysis was based on the vibration spectrum measured on the helicopter engine, provided by the consortium EADS, EUROCOPTER, DASSAULT AVIATION - 6.RP -WIreless SEnsing (WISE) project. This spectrum shows very unstable vibration levels. It was done the statistical analysis of these vibration levels and it was shown that there is a need of the power management circuit, which can provide a stable output voltage for the supplied circuit and if there is a need it can store an immediately unusable generated energy. The generator can't be used as the only energy source for the sensor circuit, because there are not any vibrations when for example a motor is stopped. In these periods and in the time of low vibration levels the circuit must be supplied from battery. The power management circuit described in this paper fulfills these requirements. It has two power inputs - the battery and the generator. It can switch between them at certain defined generator output levels by the threshold detector. Also when there is too much of the generated power, it can store the extra energy in the storage for the later usage. The storage device is the advanced capacitor. The advanced capacitor is a device containing three capacitors. These capacitors are connected (and charged) sequentially so the increasing capacity is provided. The developed power management was tested in the connection with the real vibration generator raised by stable vibration levels and the dynamic load simulating the real sensor in the main operation stages - sampling and data

  8. Measuring circuit

    DOEpatents

    Sun, Shan C.; Chaprnka, Anthony G.

    1977-01-11

    An automatic gain control circuit functions to adjust the magnitude of an input signal supplied to a measuring circuit to a level within the dynamic range of the measuring circuit while a log-ratio circuit adjusts the magnitude of the output signal from the measuring circuit to the level of the input signal and optimizes the signal-to-noise ratio performance of the measuring circuit.

  9. Guidelines of the Design of Electropyrotechnic Firing Circuit for Unmanned Flight and Ground Test Projects

    NASA Technical Reports Server (NTRS)

    Gonzalez, Guillermo A.; Lucy, Melvin H.; Massie, Jeffrey J.

    2013-01-01

    The NASA Langley Research Center, Engineering Directorate, Electronic System Branch, is responsible for providing pyrotechnic support capabilities to Langley Research Center unmanned flight and ground test projects. These capabilities include device selection, procurement, testing, problem solving, firing system design, fabrication and testing; ground support equipment design, fabrication and testing; checkout procedures and procedure?s training to pyro technicians. This technical memorandum will serve as a guideline for the design, fabrication and testing of electropyrotechnic firing systems. The guidelines will discuss the entire process beginning with requirements definition and ending with development and execution.

  10. NASA Fastrac Engine Gas Generator Component Test Program and Results

    NASA Technical Reports Server (NTRS)

    Dennis, Henry J., Jr.; Sanders, T.

    2000-01-01

    Low cost access to space has been a long-time goal of the National Aeronautics and Space Administration (NASA). The Fastrac engine program was begun at NASA's Marshall Space Flight Center to develop a 60,000-pound (60K) thrust, liquid oxygen/hydrocarbon (LOX/RP), gas generator-cycle booster engine for a fraction of the cost of similar engines in existence. To achieve this goal, off-the-shelf components and readily available materials and processes would have to be used. This paper will present the Fastrac gas generator (GG) design and the component level hot-fire test program and results. The Fastrac GG is a simple, 4-piece design that uses well-defined materials and processes for fabrication. Thirty-seven component level hot-fire tests were conducted at MSFC's component test stand #116 (TS116) during 1997 and 1998. The GG was operated at all expected operating ranges of the Fastrac engine. Some minor design changes were required to successfully complete the test program as development issues arose during the testing. The test program data results and conclusions determined that the Fastrac GG design was well on the way to meeting the requirements of NASA's X-34 Pathfinder Program that chose the Fastrac engine as its main propulsion system.

  11. A Low Impedance Marx Generator as a Test bed for Vacuum Diodes

    NASA Astrophysics Data System (ADS)

    Adhikary, Biswajit; Deb, P.; Verma, R.; Shukla, R.; Sharma, S. K.; Banerjee, P.; Das, R.; Prabaharan, T.; Das, B. K.; Shyam, Anurag

    2012-11-01

    A low impedance Marx generator was developed, which will serve as a test bed for Vacuum diodes of various electrode materials and geometries. The vacuum diodes will be used for high power microwave generation. The generator is capable to supply ~3GW of pulsed power to the vacuum diodes which is sufficient enough to produce plasma within the diode for electron beam generation. A vacuum of 10-5Torr is required for virtual cathode formation within the diode, when the beam current exceeds the space charge limiting current. A vacuum diode of reflex triode geometry has been designed and vacuum of 10-5 Torr has been achieved. The repetitive operation of the vacuum diode depends upon the recovery of the diode, the importance of the vacuum system on the recovery of the diode will be explained. A vacuum system with high voltage isolator has been installed for getting the desired vacuum within the diode. The design criterion of the vacuum system will be discussed. The 300kV/1.8kJ Marx generator which will power the vacuum diode has six stages with stage capacitance and voltage of 240nF and 50kV respectively. It has an impedance of ~7 ohm and can deliver 200kV voltage across the diode in critically damped load condition. The generator has a very fast rise time of 200ns.The operational characteristics of the Marx generator are determined experimentally. The results have been analyzed and compared to an equivalent circuit model of the system.

  12. Ground and CHAMP observations of field-aligned current circuits generated by lower atmospheric disturbances and expectations to the SWARM to clarify their three dimensional structure

    NASA Astrophysics Data System (ADS)

    Iyemori, Toshihiko; Nakanishi, Kunihito; Aoyama, Tadashi; Lühr, Hermann

    2014-05-01

    Acoustic gravity waves propagated to the ionosphere cause dynamo currents in the ionosphere. They divert along geomagnetic field lines of force to another hemisphere accompanying electric field and then flow in the ionosphere of another hemisphere by the electric field forming closed current circuits. The oscillating current circuits with the period of acoustic waves generate magnetic variations on the ground, and they are observed as long period geomagnetic pulsations. This effect has been detected during big earthquakes, strong typhoons, tornados etc. On a low-altitude satellite orbit, the spatial distribution (i.e., structure) of the current circuits along the satellite orbit should be detected as temporal magnetic oscillations, and the effect is confirmed by a CHAMP data analysis. On the spatial structure, in particular, in the longitudinal direction, it has been difficult to examine by a single satellite or from ground magnetic observations. The SWARM satellites will provide an unique opportunity to clarify the three dimensional structure of the field-aligned current circuits.

  13. Regenerative feedback resonant circuit

    DOEpatents

    Jones, A. Mark; Kelly, James F.; McCloy, John S.; McMakin, Douglas L.

    2014-09-02

    A regenerative feedback resonant circuit for measuring a transient response in a loop is disclosed. The circuit includes an amplifier for generating a signal in the loop. The circuit further includes a resonator having a resonant cavity and a material located within the cavity. The signal sent into the resonator produces a resonant frequency. A variation of the resonant frequency due to perturbations in electromagnetic properties of the material is measured.

  14. Closed cycle cryocooler for low temperature electronics circuits: Cold end test

    NASA Astrophysics Data System (ADS)

    Pirtle, F. W.

    1983-08-01

    A fabricated MACOR cold end including a metallic coating to prevent helium permeation and a fabricated die post displacer support bearing were combined with a compressor and motor which are standard CTI-CRYOGENICS products. A mechanical test was performed on the test cryocooler to determine that the mechanical test was performed on the test cryocooler to determine that the MACOR displacer was successfully guided by the die post bearing. Thermodynamic tests were conducted to determine the lowest temperature of the 4th (coldest) stage as a function of operating speed, helium charge pressure, 4th stage electrical heat load, and transfer tube diameter. Cooldown and steady state results are reported. Results indicate a low temperature limit of approximately 95K with the current test hardware. Although this represents an improvement from 122K during the program, a resizing will be necessary to reach 10K. The die post displacer support bearing and the MACOR cold finger construction are mechanically satisfactory.

  15. Clinch River Breeder Reactor Plant Steam Generator Few Tube Test model post-test examination

    SciTech Connect

    Impellezzeri, J.R.; Camaret, T.L.; Friske, W.H.

    1981-03-11

    The Steam Generator Few Tube Test (FTT) was part of an extensive testing program carried out in support of the Clinch River Breeder Reactor Plant (CRBRP) steam generator design. The testing of full-length seven-tube evaporator and three-tube superheater models of the CRBRP design was conducted to provide steady-state thermal/hydraulic performance data to full power per tube and to verify the absence of multi-year endurance problems. This paper describes the problems encountered with the mechanical features of the FTT model design which led to premature test termination, and the results of the post-test examination. Conditions of tube bowing and significant tube and tube support gouging was observed. An interpretation of the visual and metallurgical observations is also presented. The CRBRP steam generator has undergone design evaluations to resolve observed deficiences found in the FFTM.

  16. INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY: Efficient One-Step Generation of Cluster State with Charge Qubits in Circuit QED

    NASA Astrophysics Data System (ADS)

    Wang, Yi-Min; Li, Cheng-Zu

    2010-01-01

    We propose theoretical schemes to generate highly entangled cluster state with superconducting qubits in a circuit QED architecture. Charge qubits are located inside a superconducting transmission line, which serves as a quantum data bus. We show that large clusters state can be efficiently generated in just one step with the long-range Ising-like unitary operators. The quantum operations which are generally realized by two coupling mechanisms: either voltage coupling or current coupling, depend only on global geometric features and are insensitive not only to the thermal state of the transmission line but also to certain random operation errors. Thus high-fidelity one-way quantum computation can be achieved.

  17. Generation of Simulated Tracking Data for LADEE Operational Readiness Testing

    NASA Technical Reports Server (NTRS)

    Woodburn, James; Policastri, Lisa; Owens, Brandon

    2015-01-01

    Operational Readiness Tests were an important part of the pre-launch preparation for the LADEE mission. The generation of simulated tracking data to stress the Flight Dynamics System and the Flight Dynamics Team was important for satisfying the testing goal of demonstrating that the software and the team were ready to fly the operational mission. The simulated tracking was generated in a manner to incorporate the effects of errors in the baseline dynamical model, errors in maneuver execution and phenomenology associated with various tracking system based components. The ability of the mission team to overcome these challenges in a realistic flight dynamics scenario indicated that the team and flight dynamics system were ready to fly the LADEE mission. Lunar Atmosphere and Dust Environment.

  18. Automatic Generation of Test Oracles - From Pilot Studies to Application

    NASA Technical Reports Server (NTRS)

    Feather, Martin S.; Smith, Ben

    1998-01-01

    There is a trend towards the increased use of automation in V&V. Automation can yield savings in time and effort. For critical systems, where thorough V&V is required, these savings can be substantial. We describe a progression from pilot studies to development and use of V&V automation. We used pilot studies to ascertain opportunities for, and suitability of, automating various analyses whose results would contribute to V&V. These studies culminated in the development of an automatic generator of automated test oracles. This was then applied and extended in the course of testing an Al planning system that is a key component of an autonomous spacecraft.

  19. Facility for generating crew waste water product for ECLSS testing

    NASA Technical Reports Server (NTRS)

    Buitekant, Alan; Roberts, Barry C.

    1990-01-01

    An End-use Equipment Facility (EEF) has been constructed which is used to simulate water interfaces between the Space Station Freedom Environmental Control and Life Support Systems (ECLSS) and man systems. The EEF is used to generate waste water to be treated by ECLSS water recovery systems. The EEF will also be used to close the water recovery loop by allowing test subjects to use recovered hygiene and potable water during several phases of testing. This paper describes the design and basic operation of the EEF.

  20. Elevated voltage level I.sub.DDQ failure testing of integrated circuits

    DOEpatents

    Righter, Alan W.

    1996-01-01

    Burn in testing of static CMOS IC's is eliminated by I.sub.DDQ testing at elevated voltage levels. These voltage levels are at least 25% higher than the normal operating voltage for the IC but are below voltage levels that would cause damage to the chip.

  1. Elevated voltage level I{sub DDQ} failure testing of integrated circuits

    DOEpatents

    Righter, A.W.

    1996-05-21

    Burn in testing of static CMOS IC`s is eliminated by I{sub DDQ} testing at elevated voltage levels. These voltage levels are at least 25% higher than the normal operating voltage for the IC but are below voltage levels that would cause damage to the chip. 4 figs.

  2. Shape matching utilizing indexed hypotheses generation and testing

    NASA Technical Reports Server (NTRS)

    Mehrotra, Rajiv; Grosky, William I.

    1989-01-01

    An indexing mechanism is developed as part of an overall scheme called SMITH (shape matching utilizing indexed hypothesis generation and testing) for two-dimensional model-based object recognition. The approach is based on a dynamic programming implementation of attributed string matching, is computationally efficient, and works effectively for both nonoccluded and occluded shapes. Another advantage of this technique is that models may be inserted or deleted with relatively little cost.

  3. NREL Next Generation Drivetrain: Mechanical Design and Test Plan (Poster)

    SciTech Connect

    Keller, J.; Halse, C.

    2014-05-01

    The Department of Energy and industry partners are sponsoring a $3m project for design and testing of a 'Next Generation' wind turbine drivetrain at the National Renewable Energy Laboratory (NREL). This poster focuses on innovative aspects of the gearbox design, completed as part of an end-to-end systems engineering approach incorporating innovations that increase drivetrain reliability, efficiency, torque density and minimize capital cost.

  4. Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 1: Tests with open circuits

    NASA Technical Reports Server (NTRS)

    Barna, P. Stephen

    1991-01-01

    This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period of November 1989 to December 1990. Throughout the testing the tunnel was operated in the 'open circuit mode', that is when the airflow was induced by a powerful exhaust fan located outside the tunnel circuit. The tests were first performed with the closed test section and were subsequently repeated with the open test section. While operating with the open test section, a novel device, called the 'nozzle-diffuser,' was also tested in order to establish its usefulness of increasing pressure recovery in the first diffuser. The tests established the viability of the tunnel design. The flow distribution in each tunnel component was found acceptable and pressure recovery in the diffusers were found satisfactory. The diffusers appeared to operate without flow separation. All tests were performed at NASA LaRC.

  5. Low distortion automatic phase control circuit

    NASA Technical Reports Server (NTRS)

    Hauge, G.; Pederson, C. W.

    1972-01-01

    Circuit for generation and demodulation of quadrature double side band signals in frequency division multiplexing system is described. Circuit is designed to produce low distortion automatic phase control. Illustration of circuit and components is included.

  6. Driver circuit

    NASA Technical Reports Server (NTRS)

    Matsumoto, Raymond T. (Inventor); Higashi, Stanley T. (Inventor)

    1976-01-01

    A driver circuit which has low power requirements, a relatively small number of components and provides flexibility in output voltage setting. The driver circuit comprises, essentially, two portions which are selectively activated by the application of input signals. The output signal is determined by which of the two circuit portions is activated. While each of the two circuit portions operates in a manner similar to silicon controlled rectifiers (SCR), the circuit portions are on only when an input signal is supplied thereto.

  7. Automated ILA design for synchronous sequential circuits

    NASA Technical Reports Server (NTRS)

    Liu, M. N.; Liu, K. Z.; Maki, G. K.; Whitaker, S. R.

    1991-01-01

    An iterative logic array (ILA) architecture for synchronous sequential circuits is presented. This technique utilizes linear algebra to produce the design equations. The ILA realization of synchronous sequential logic can be fully automated with a computer program. A programmable design procedure is proposed to fullfill the design task and layout generation. A software algorithm in the C language has been developed and tested to generate 1 micron CMOS layouts using the Hewlett-Packard FUNGEN module generator shell.

  8. 77 FR 14167 - Approval Tests and Standards for Closed-Circuit Escape Respirators

    Federal Register 2010, 2011, 2012, 2013, 2014

    2012-03-08

    ... indicating problems) and that indicators should become permanently altered to indicate material or functional... & Metabolic Simulator 2. Carbon Dioxide 3. Oxygen 4. Peak Breathing Pressures 5. Wet-Bulb Temperature L.... Humidity 2. Temperature 3. Shock 4. Vibration P. Section 84.308 Additional Testing Q. Section...

  9. Theoretical analysis and modeling of a photonic integrated circuit for frequency 8-tupled and 24-tupled millimeter wave signal generation.

    PubMed

    Hasan, Mehedi; Guemri, Rabiaa; Maldonado-Basilio, Ramón; Lucarz, Frédéric; de Bougrenet de la Tocnaye, Jean-Louis; Hall, Trevor

    2014-12-15

    A photonic circuit design for implementing frequency 8-tupling and 24-tupling is proposed. The front- and back-end of the circuit comprises 4×4 MMI couplers enclosing an array of four pairs of phase modulators and 2×2 MMI couplers. The proposed design for frequency multiplication requires no optical or electrical filters, the operation is not limited to carefully adjusted modulation indexes, and the drift originated from static DC bias is mitigated by making use of the intrinsic phase relations of multi-mode interference couplers. A transfer matrix approach is used to represent the main building blocks of the design and hence to describe the operation of the frequency 8-tupling and 24-tupling. The concept is theoretically developed and demonstrated by simulations. Ideal and imperfect power imbalances in the multi-mode interference couplers, as well as ideal and imperfect phases of the electric drives to the phase modulators, are analyzed.

  10. Investigation, Analysis, and Testing of Self-contained Oxygen Generators

    NASA Technical Reports Server (NTRS)

    Keddy, Christopher P.; Haas, Jon P.; Starritt, Larry

    2008-01-01

    Self Contained Oxygen Generators (SCOGs) have widespread use in providing emergency breathing oxygen in a variety of environments including mines, submarines, spacecraft, and aircraft. These devices have definite advantages over storing of gaseous or liquid oxygen. The oxygen is not generated until a chemical briquette containing a chlorate or perchlorate oxidizer and a solid metallic fuel such as iron is ignited starting a thermal decomposition process allowing gaseous oxygen to be produced. These devices are typically very safe to store, easy to operate, and have primarily only a thermal hazard to the operator that can be controlled by barriers or furnaces. Tens of thousands of these devices are operated worldwide every year without major incident. This report examines the rare case of a SCOG whose behavior was both abnormal and lethal. This particular type of SCOG reviewed is nearly identical to a flight qualified version of SCOG slated for use on manned space vehicles. This Investigative Report is a compilation of a NASA effort in conjunction with other interested parties including military and aerospace to understand the causes of the particular SCOG accident and what preventative measures can be taken to ensure this incident is not repeated. This report details the incident and examines the root causes of the observed SCOG behavior from forensic evidence. A summary of chemical and numerical analysis is provided as a background to physical testing of identical SCOG devices. The results and findings of both small scale and full scale testing are documented on a test-by-test basis along with observations and summaries. Finally, conclusions are presented on the findings of this investigation, analysis, and testing along with suggestions on preventative measures for any entity interested in the safe use of these devices.

  11. Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods

    NASA Technical Reports Server (NTRS)

    Johnson, G. M.

    1976-01-01

    The application of high temperature accelerated test techniques was shown to be an effective method of microcircuit defect screening. Comprehensive microcircuit evaluations and a series of high temperature (473 K to 573 K) life tests demonstrated that a freak or early failure population of surface contaminated devices could be completely screened in thirty two hours of test at an ambient temperature of 523 K. Equivalent screening at 398 K, as prescribed by current Military and NASA specifications, would have required in excess of 1,500 hours of test. All testing was accomplished with a Texas Instruments' 54L10, low power triple-3 input NAND gate manufactured with a titanium- tungsten (Ti-W), Gold (Au) metallization system. A number of design and/or manufacturing anomalies were also noted with the Ti-W, Au metallization system. Further study of the exact nature and cause(s) of these anomalies is recommended prior to the use of microcircuits with Ti-W, Au metallization in long life/high reliability applications. Photomicrographs of tested circuits are included.

  12. Universal test fixture for monolithic mm-wave integrated circuits calibrated with an augmented TRD algorithm

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert R.; Shalkhauser, Kurt A.

    1989-01-01

    The design and evaluation of a novel fixturing technique for characterizing millimeter wave solid state devices is presented. The technique utilizes a cosine-tapered ridge guide fixture and a one-tier de-embedding procedure to produce accurate and repeatable device level data. Advanced features of this technique include nondestructive testing, full waveguide bandwidth operation, universality of application, and rapid, yet repeatable, chip-level characterization. In addition, only one set of calibration standards is required regardless of the device geometry.

  13. Quantum Statistical Testing of a Quantum Random Number Generator

    SciTech Connect

    Humble, Travis S

    2014-01-01

    The unobservable elements in a quantum technology, e.g., the quantum state, complicate system verification against promised behavior. Using model-based system engineering, we present methods for verifying the opera- tion of a prototypical quantum random number generator. We begin with the algorithmic design of the QRNG followed by the synthesis of its physical design requirements. We next discuss how quantum statistical testing can be used to verify device behavior as well as detect device bias. We conclude by highlighting how system design and verification methods must influence effort to certify future quantum technologies.

  14. Development of nondestructive testing techniques for plated-through holes in multilayer printed circuit boards

    NASA Technical Reports Server (NTRS)

    Anthony, P. L.; Mcmurtrey, J. E.

    1971-01-01

    The development of a nondestructive test with the capability to interrogate plated-through holes as small as 0.51 millimeters inside diameter is discussed. The system can detect defects such as holes, voids, cracks, and thin spots that reduce the current carrying capability of plates-through interconnects by 20 percent or more. Efforts were directed toward the design and fabrication of magnetic circuitry mutual coupling probes and to evaluate the effectiveness of these devices for detecting in multilayer board plated-through holes.

  15. Radioisotope thermoelectric generator/thin fragment impact test

    NASA Astrophysics Data System (ADS)

    Reimus, M. A. H.; Hinckley, J. E.

    1998-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of 238Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel.

  16. End-on radioisotope thermoelectric generator impact tests

    NASA Astrophysics Data System (ADS)

    Reimus, M. A. H.; Hinckley, J. E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of 238Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure.

  17. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M.A.H.; Hinckley, J.E.

    1998-12-31

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the convertor housing, failure of one fueled clad, and release of a small quantity of fuel.

  18. End-on radioisotope thermoelectric generator impact tests

    SciTech Connect

    Reimus, M.A.H.; Hhinckley, J.E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of [sup 238]Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure.

  19. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M. A. H.; Hinckley, J. E.

    1998-01-15

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel.

  20. Radioisotope thermoelectric generator/thin fragment impact test

    SciTech Connect

    Reimus, M.A.; Hinckley, J.E.

    1998-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). Because the potential for a launch abort or return from orbit exists for any space mission, the heat source response to credible accident scenarios is being evaluated. This test was designed to provide information on the response of a loaded RTG to impact by a fragment similar to the type of fragment produced by breakup of the spacecraft propulsion module system (PMS). The results of this test indicated that impact of the RTG by a thin aluminum fragment traveling at 306 m/s may result in significant damage to the converter housing, failure of one fueled clad, and release of a small quantity of fuel. {copyright} {ital 1998 American Institute of Physics.}

  1. End-on radioisotope thermoelectric generator impact tests

    SciTech Connect

    Reimus, M.A.; Hinckley, J.E.

    1997-01-01

    The General-Purpose Heat Source (GPHS) provides power for space missions by transmitting the heat of {sup 238}Pu decay to an array of thermoelectric elements in a radioisotope thermoelectric generator (RTG). The modular GPHS design was developed to address both survivability during launch abort and return from orbit. The first two RTG Impact Tests were designed to provide information on the response of a fully loaded RTG to end-on impact against a concrete target. The results of these tests indicated that at impact velocities up to 57 m/s the converter shell and internal components protect the GPHS capsules from excessive deformation. At higher velocities, some of the internal components of the RTG interact with the GPHS capsules to cause excessive localized deformation and failure. {copyright} {ital 1997 American Institute of Physics.}

  2. LOGIC CIRCUIT

    DOEpatents

    Strong, G.H.; Faught, M.L.

    1963-12-24

    A device for safety rod counting in a nuclear reactor is described. A Wheatstone bridge circuit is adapted to prevent de-energizing the hopper coils of a ball backup system if safety rods, sufficient in total control effect, properly enter the reactor core to effect shut down. A plurality of resistances form one arm of the bridge, each resistance being associated with a particular safety rod and weighted in value according to the control effect of the particular safety rod. Switching means are used to switch each of the resistances in and out of the bridge circuit responsive to the presence of a particular safety rod in its effective position in the reactor core and responsive to the attainment of a predetermined velocity by a particular safety rod enroute to its effective position. The bridge is unbalanced in one direction during normal reactor operation prior to the generation of a scram signal and the switching means and resistances are adapted to unbalance the bridge in the opposite direction if the safety rods produce a predetermined amount of control effect in response to the scram signal. The bridge unbalance reversal is then utilized to prevent the actuation of the ball backup system, or, conversely, a failure of the safety rods to produce the predetermined effect produces no unbalance reversal and the ball backup system is actuated. (AEC)

  3. Achieving Maximum Power from Thermoelectric Generators with Maximum-Power-Point-Tracking Circuits Composed of a Boost-Cascaded-with-Buck Converter

    NASA Astrophysics Data System (ADS)

    Park, Hyunbin; Sim, Minseob; Kim, Shiho

    2015-06-01

    We propose a way of achieving maximum power and power-transfer efficiency from thermoelectric generators by optimized selection of maximum-power-point-tracking (MPPT) circuits composed of a boost-cascaded-with-buck converter. We investigated the effect of switch resistance on the MPPT performance of thermoelectric generators. The on-resistances of the switches affect the decrease in the conversion gain and reduce the maximum output power obtainable. Although the incremental values of the switch resistances are small, the resulting difference in the maximum duty ratio between the input and output powers is significant. For an MPPT controller composed of a boost converter with a practical nonideal switch, we need to monitor the output power instead of the input power to track the maximum power point of the thermoelectric generator. We provide a design strategy for MPPT controllers by considering the compromise in which a decrease in switch resistance causes an increase in the parasitic capacitance of the switch.

  4. Thermal vacuum life test facility for radioisotope thermoelectric generators

    NASA Astrophysics Data System (ADS)

    Deaton, R. L.; Goebel, C. J.; Amos, W. R.

    In the late 1970's, the Department of Energy (DOE) assigned Monsanto Research Corporation, Mound Facility, now operated by EG and G Mound Applied Technologies, the responsibility for assembling and testing General Purpose Heat Source (GPHS) radioisotope thermoelectric generators (RTGs). Assembled and tested were five RTGs, which included four flight units and one non-flight qualification unit. Figure 1 shows the RTG, which was designed by General Electric AstroSpace Division (GE/ASD) to produce 285 W of electrical power. A detailed description of the processes for RTG assembly and testing is presented by Amos and Goebel (1989). The RTG performance data are described by Bennett, et al., (1986). The flight units will provide electrical power for the National Aeronautics and Space Administration's (NASA) Galileo mission to Jupiter (two RTGs) and the joint NASA/European Space Agency (ESA) Ulysses mission to study the polar regions of the sun (one RTG). The remaining flight unit will serve as the spare for both missions, and a non-flight qualification unit was assembled and tested to ensure that performance criteria were adequately met.

  5. Design, fabrication, and testing of energy-harvesting thermoelectric generator

    NASA Astrophysics Data System (ADS)

    Jovanovic, Velimir; Ghamaty, Saeid

    2006-03-01

    An energy-harvesting thermoelectric generator (TEG) is being developed to provide power for wireless sensors used in health monitoring of Navy machinery. TEGs are solid-state devices that convert heat directly into electricity without any moving parts. In this application, the TEGs utilize the heat transfer between shipboard waste heat sources and the ambient air to generate electricity. In order to satisfy the required small design volume of less than one cubic inch, Hi-Z is using its innovative thin-film Quantum Well (QW) thermoelectric technology that will provide a factor of four increase in efficiency and a large reduction in the device volume over the currently used bulk Bi IITe 3 based thermoelectics. QWs are nanostructured multi-layer films. These wireless sensors can be used to detect cracks, corrosion, impact damage, and temperature and vibration excursions as part of the Condition Based Maintenance (CBM) of the Navy ship machinery. The CBM of the ship machinery can be significantly improved by automating the process with the use of self-powered wireless sensors. These power-harvesting TEGs can be used to replace batteries as electrical power sources and to eliminate power cables and data lines. The first QW TEG module was fabricated and initial tests were successful. It is planned to conduct performance tests the entire prototype QW TEG device (consisting of the TEG module, housing, thermal insulation and the heat sink) in a simulated thermal environment of a Navy ship.

  6. Investigation of multilayer printed circuit board (PCB) film warpage using viscoelastic properties measured by a vibration test

    NASA Astrophysics Data System (ADS)

    Joo, Sung-Jun; Park, Buhm; Kim, Do-Hyoung; Kwak, Dong-Ok; Song, In-Sang; Park, Junhong; Kim, Hak-Sung

    2015-03-01

    Woven glass fabric/BT (bismaleimide triazine) composite laminate (BT core), copper (Cu), and photoimageable solder resist (PSR) are the most widely used materials for semiconductors in electronic devices. Among these materials, BT core and PSR contain polymeric materials that exhibit viscoelastic behavior. For this reason, these materials are considered to have time- and temperature-dependent moduli during warpage analysis. However, the thin geometry of multilayer printed circuit board (PCB) film makes it difficult to identify viscoelastic characteristics. In this work, a vibration test method was proposed for measuring the viscoelastic properties of a multilayer PCB film at different temperatures. The beam-shaped specimens, composed of a BT core, Cu laminated on a BT core, and PSR and Cu laminated on a BT core, were used in the vibration test. The frequency-dependent variation of the complex bending stiffness was determined using a transfer function method. The storage modulus (E‧) of the BT core, Cu, and PSR as a function of temperature and frequency were obtained, and their temperature-dependent variation was identified. The obtained properties were fitted using a viscoelastic model for the BT core and the PSR, and a linear elastic model for the Cu. Warpage of a line pattern specimen due to temperature variation was measured using a shadow Moiré analysis and compared to predictions using a finite element model. The results provide information on the mechanism of warpage, especially warpage due to temperature-dependent variation in viscoelastic properties.

  7. Advanced E-O test capability for Army Next-Generation Automated Test System (NGATS)

    NASA Astrophysics Data System (ADS)

    Errea, S.; Grigor, J.; King, D. F.; Matis, G.; McHugh, S.; McKechnie, J.; Nehring, B.

    2015-05-01

    The Future E-O (FEO) program was established to develop a flexible, modular, automated test capability as part of the Next Generation Automatic Test System (NGATS) program to support the test and diagnostic needs of currently fielded U.S. Army electro-optical (E-O) devices, as well as being expandable to address the requirements of future Navy, Marine Corps and Air Force E-O systems. Santa Barbara infrared (SBIR) has designed, fabricated, and delivered three (3) prototype FEO for engineering and logistics evaluation prior to anticipated full-scale production beginning in 2016. In addition to presenting a detailed overview of the FEO system hardware design, features and testing capabilities, the integration of SBIR's EO-IR sensor and laser test software package, IRWindows 4™, into FEO to automate the test execution, data collection and analysis, archiving and reporting of results is also described.

  8. Single Stage Contactor Testing Of The Next Generation Solvent Blend

    SciTech Connect

    Herman, D. T.; Peters, T. B.; Duignan, M. R.; Williams, M. R.; Poirier, M. R.; Brass, E. A.; Garrison, A. G.; Ketusky, E. T.

    2014-01-06

    The Modular Caustic Side Solvent Extraction (CSSX) Unit (MCU) facility at the Savannah River Site (SRS) is actively pursuing the transition from the current BOBCalixC6 based solvent to the Next Generation Solvent (NGS)-MCU solvent to increase the cesium decontamination factor. To support this integration of NGS into the MCU facility the Savannah River National Laboratory (SRNL) performed testing of a blend of the NGS (MaxCalix based solvent) with the current solvent (BOBCalixC6 based solvent) for the removal of cesium (Cs) from the liquid salt waste stream. This testing utilized a blend of BOBCalixC6 based solvent and the NGS with the new extractant, MaxCalix, as well as a new suppressor, tris(3,7dimethyloctyl) guanidine. Single stage tests were conducted using the full size V-05 and V-10 liquid-to-liquid centrifugal contactors installed at SRNL. These tests were designed to determine the mass transfer and hydraulic characteristics with the NGS solvent blended with the projected heel of the BOBCalixC6 based solvent that will exist in MCU at time of transition. The test program evaluated the amount of organic carryover and the droplet size of the organic carryover phases using several analytical methods. The results indicate that hydraulically, the NGS solvent performed hydraulically similar to the current solvent which was expected. For the organic carryover 93% of the solvent is predicted to be recovered from the stripping operation and 96% from the extraction operation. As for the mass transfer, the NGS solvent significantly improved the cesium DF by at least an order of magnitude when extrapolating the One-stage results to actual Seven-stage extraction operation with a stage efficiency of 95%.

  9. Processing and Prolonged 500 C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect

    NASA Technical Reports Server (NTRS)

    Spry, David J.; Neudeck, Philip G.; Chen, Liangyu; Lukco, Dorothy; Chang, Carl W.; Beheim, Glenn M.; Krasowski, Michael J.; Prokop, Norman F.

    2015-01-01

    Complex integrated circuit (IC) chips rely on more than one level of interconnect metallization for routing of electrical power and signals. This work reports the processing and testing of 4H-SiC junction field effect transistor (JFET) prototype IC's with two levels of metal interconnect capable of prolonged operation at 500 C. Packaged functional circuits including 3- and 11-stage ring oscillators, a 4-bit digital to analog converter, and a 4-bit address decoder and random access memory cell have been demonstrated at 500 C. A 3-stage oscillator functioned for over 3000 hours at 500 C in air ambient. Improved reproducibility remains to be accomplished.

  10. Processing and Prolonged 500 C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect

    NASA Technical Reports Server (NTRS)

    Spry, David J.; Neudeck, Philip G.; Chen, Liangyu; Lukco, Dorothy; Chang, Carl W.; Beheim, Glenn M.; Krasowski, Michael J.; Prokop, Norman F.

    2015-01-01

    Complex integrated circuit (IC) chips rely on more than one level of interconnect metallization for routing of electrical power and signals. This work reports the processing and testing of 4H-SiC junction field effect transistor (JFET) prototype ICs with two levels of metal interconnect capable of prolonged operation at 500 C. Packaged functional circuits including 3-and 11-stage ring oscillators, a 4-bit digital to analog converter, and a 4-bit address decoder and random access memory cell have been demonstrated at 500 C. A 3-stage oscillator functioned for over 3000 hours at 500 C in air ambient.

  11. Does quantity generate quality? Testing the fundamental principle of brainstorming.

    PubMed

    Muñoz Adánez, Alfredo

    2005-11-01

    The purpose of this work is to test the chief principle of brainstorming, formulated as "quantity generates quality." The study is included within a broad program whose goal is to detect the strong and weak points of creative techniques. In a sample of 69 groups, containing between 3 and 8 members, the concurrence of two commonly accepted criteria was established as a quality rule: originality and utility or value. The results fully support the quantity-quality relation (r = .893): the more ideas produced to solve a problem, the better quality of the ideas. The importance of this finding, which supports Osborn's theory, is discussed, and the use of brainstorming is recommended to solve the many open problems faced by our society.

  12. TESTING OF THE SECOND GENERATION SPINTEK ROTARY FILTER -11357

    SciTech Connect

    Herman, D.; Poirier, M.; Fowley, M.; Keefer, M.; Huff, T.

    2011-02-02

    The SpinTek rotary microfilter has been developed under the Department of Energy (DOE) Office of Environmental Management (EM) for the purpose of deployment in radioactive service in the DOE complex. The unit that was fabricated and tested is the second generation of the filter that incorporates recommended improvements from previous testing. The completion of this test satisfied a key milestone for the EM technology development program and technology readiness for deployment by Savannah River Remediation in the Small Column Ion Exchange and Sludge Washing processes at the Savannah River Site (SRS). The Savannah River National Laboratory (SRNL) contracted SpinTek Filtration to fabricate a full scale 25 disk rotary filter and perform a 1000 hour endurance test with a simulated SRS sludge. Over 1500 hours of operation have been completed with the filter. SpinTek Filtration fabricated a prototypic 25 disk rotary filter including updates to manufacturing tolerances, an updated design to the rotary joint, improved cooling to the bottom journal, decreases in disk and filter shaft hydraulic resistances. The filter disks were fabricated with 0.5 {micro} pore size, sintered-metal filter media manufactured by Pall Corporation (M050). After fabrication was complete, the filter passed acceptance tests demonstrating rejection of solids and clean water flux with a 50% improvement over the previous filters. Once the acceptance test was complete, a 1000 hour endurance test was initiated simulating a sludge washing process. The test used a simulated SRS Sludge Batch 6 recipe. The insoluble solids started at 5 wt% and were raised to 10 and 15 wt% insoluble solids to simulate the concentration of a large volume tank. The filter system was automated and set up for 24 hour unattended operation. To facilitate this, process control logic was written to operate the filter. During the development it was demonstrated that the method of starting and stopping the filter can affect the build

  13. Rupture testing for the quality control of electrodeposited copper interconnections in high-speed, high-density circuits

    NASA Technical Reports Server (NTRS)

    Zakraysek, Louis

    1987-01-01

    Printed Wiring Multilayer Board (PWMLB) structures for high speed, high density circuits are prone to failure due to the microcracking of electrolytic copper interconnections. The failure can occur in the foil that makes up the inner layer traces or in the plated through holes (PTH) deposit that forms the layer to layer interconnections. It is shown that there are some distinctive differences in the quality of Type E copper and that these differences can be detected before its use in a PWMLB. It is suggested that the strength of some Type E copper can be very low when the material is hot and that it is the use of this poor quality material in a PWMLB that results in PTH and inner layer microcracking. Since the PWMLB failure in question are induced by a thermal stress, and since the poorer grades of Type E materials used in these structures are susceptible to premature failure under thermal stress, the use of elevated temperature rupture and creep rupture testing is proposed as a means for screening copper foil, or its PTH equivalent, in order to eliminate the problem of Type E copper microcracking in advanced PWMLBs.

  14. Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 2: Tests with the closed circuit

    NASA Technical Reports Server (NTRS)

    Barna, P. Stephen

    1991-01-01

    This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period June - August 1991. Throughout the testing the tunnel was operated in the 'closed circuit mode,' that is when the airflow was set up by an axial flow fan, which was located inside the tunnel circuit and was directly driven by a motor. The tests were first performed with the closed test section and were subsequently repeated with the open test section, the latter operating with the nozzle-diffuser at its optimum setting. On this subject, reference is made to the report (1) issued January 1991, under contract 17-GFY900125, which summarizes the result obtained with the tunnel operating in the 'open circuit mode.' The tests confirmed the viability of the tunnel design, and the flow distributions in most of the tunnel components were considered acceptable. There were found, however, some locations where the flow distribution requires improvement. This applies to the flow upstream of the fan where the flow was found skewed, thus affecting the flow downstream. As a result of this, the flow appeared separated at the end of the large diffuser at the outer side. All tests were performed at NASA LaRC.

  15. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  16. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  17. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Electronic noise generator for audiometric testing... noise generator for audiometric testing. (a) Identification. An electronic noise generator for audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an...

  18. A MyoD-generated feed-forward circuit temporally patterns gene expression during skeletal muscle differentiation

    PubMed Central

    Penn, Bennett H.; Bergstrom, Donald A.; Dilworth, F. Jeffrey; Bengal, Eyal; Tapscott, Stephen J.

    2004-01-01

    The development and differentiation of distinct cell types is achieved through the sequential expression of subsets of genes; yet, the molecular mechanisms that temporally pattern gene expression remain largely unknown. In skeletal myogenesis, gene expression is initiated by MyoD and includes the expression of specific Mef2 isoforms and activation of the p38 mitogen-activated protein kinase (MAPK) pathway. Here, we show that p38 activity facilitates MyoD and Mef2 binding at a subset of late-activated promoters, and the binding of Mef2D recruits Pol II. Most importantly, expression of late-activated genes can be shifted to the early stages of differentiation by precocious activation of p38 and expression of Mef2D, demonstrating that a MyoD-mediated feed-forward circuit temporally patterns gene expression. PMID:15466486

  19. Polymorphic Electronic Circuits

    NASA Technical Reports Server (NTRS)

    Stoica, Adrian

    2004-01-01

    Polymorphic electronics is a nascent technological discipline that involves, among other things, designing the same circuit to perform different analog and/or digital functions under different conditions. For example, a circuit can be designed to function as an OR gate or an AND gate, depending on the temperature (see figure). Polymorphic electronics can also be considered a subset of polytronics, which is a broader technological discipline in which optical and possibly other information- processing systems could also be designed to perform multiple functions. Polytronics is an outgrowth of evolvable hardware (EHW). The basic concepts and some specific implementations of EHW were described in a number of previous NASA Tech Briefs articles. To recapitulate: The essence of EHW is to design, construct, and test a sequence of populations of circuits that function as incrementally better solutions of a given design problem through the selective, repetitive connection and/or disconnection of capacitors, transistors, amplifiers, inverters, and/or other circuit building blocks. The evolution is guided by a search-and-optimization algorithm (in particular, a genetic algorithm) that operates in the space of possible circuits to find a circuit that exhibits an acceptably close approximation of the desired functionality. The evolved circuits can be tested by computational simulation (in which case the evolution is said to be extrinsic), tested in real hardware (in which case the evolution is said to be intrinsic), or tested in random sequences of computational simulation and real hardware (in which case the evolution is said to be mixtrinsic).

  20. Concept For Generation Of Long Pseudorandom Sequences

    NASA Technical Reports Server (NTRS)

    Wang, C. C.

    1990-01-01

    Conceptual very-large-scale integrated (VLSI) digital circuit performs exponentiation in finite field. Algorithm that generates unusually long sequences of pseudorandom numbers executed by digital processor that includes such circuits. Concepts particularly advantageous for such applications as spread-spectrum communications, cryptography, and generation of ranging codes, synthetic noise, and test data, where usually desirable to make pseudorandom sequences as long as possible.

  1. Tone signal generator for producing multioperator tone signals using an operator circuit including a waveform generator, a selector and an enveloper

    DOEpatents

    Dong, Q.; Jenkins, M.V.; Bernadas, S.R.

    1997-09-09

    A frequency modulation (FM) tone signal generator for generating a FM tone signal is disclosed. The tone signal generator includes a waveform generator having a plurality of wave tables, a selector and an enveloper. The waveform generator furnishes a waveform signal in response to a phase angle address signal. Each wave table stores a different waveform. The selector selects one of the wave tables in response to a plurality of selection signals such that the selected wave table largely provides the waveform signal upon being addressed largely by the phase angle address signal. Selection of the selected wave table varies with each selection signal. The enveloper impresses an envelope signal on the waveform signal. The envelope signal is used as a carrier or modulator for generating the FM tone signal. 17 figs.

  2. Tone signal generator for producing multioperator tone signals using an operator circuit including a waveform generator, a selector and an enveloper

    DOEpatents

    Dong, Qiujie; Jenkins, Michael V.; Bernadas, Salvador R.

    1997-01-01

    A frequency modulation (FM) tone signal generator for generating a FM tone signal is disclosed. The tone signal generator includes a waveform generator having a plurality of wave tables, a selector and an enveloper. The waveform generator furnishes a waveform signal in response to a phase angle address signal. Each wave table stores a different waveform. The selector selects one of the wave tables in response to a plurality of selection signals such that the selected wave table largely provides the waveform signal upon being addressed largely by the phase angle address signal. Selection of the selected wave table varies with each selection signal. The enveloper impresses an envelope signal on the waveform signal. The envelope signal is used as a carrier or modulator for generating the FM tone signal.

  3. Statistical circuit design for yield improvement in CMOS circuits

    NASA Technical Reports Server (NTRS)

    Kamath, H. J.; Purviance, J. E.; Whitaker, S. R.

    1990-01-01

    This paper addresses the statistical design of CMOS integrated circuits for improved parametric yield. The work uses the Monte Carlo technique of circuit simulation to obtain an unbiased estimation of the yield. A simple graphical analysis tool, the yield factor histogram, is presented. The yield factor histograms are generated by a new computer program called SPICENTER. Using the yield factor histograms, the most sensitive circuit parameters are noted, and their nominal values are changed to improve the yield. Two basic CMOS example circuits, one analog and one digital, are chosen and their designs are 'centered' to illustrate the use of the yield factor histograms for statistical circuit design.

  4. Internal short circuit and accelerated rate calorimetry tests of lithium-ion cells: Considerations for methane-air intrinsic safety and explosion proof/flameproof protection methods

    PubMed Central

    Dubaniewicz, Thomas H.; DuCarme, Joseph P.

    2016-01-01

    Researchers with the National Institute for Occupational Safety and Health (NIOSH) studied the potential for lithium-ion cell thermal runaway from an internal short circuit in equipment for use in underground coal mines. In this third phase of the study, researchers compared plastic wedge crush-induced internal short circuit tests of selected lithium-ion cells within methane (CH4)-air mixtures with accelerated rate calorimetry tests of similar cells. Plastic wedge crush test results with metal oxide lithium-ion cells extracted from intrinsically safe evaluated equipment were mixed, with one cell model igniting the chamber atmosphere while another cell model did not. The two cells models exhibited different internal short circuit behaviors. A lithium iron phosphate (LiFePO4) cell model was tolerant to crush-induced internal short circuits within CH4-air, tested under manufacturer recommended charging conditions. Accelerating rate calorimetry tests with similar cells within a nitrogen purged 353-mL chamber produced ignitions that exceeded explosion proof and flameproof enclosure minimum internal pressure design criteria. Ignition pressures within a 20-L chamber with 6.5% CH4-air were relatively low, with much larger head space volume and less adiabatic test conditions. The literature indicates that sizeable lithium thionyl chloride (LiSOCl2) primary (non rechargeable) cell ignitions can be especially violent and toxic. Because ignition of an explosive atmosphere is expected within explosion proof or flameproof enclosures, there is a need to consider the potential for an internal explosive atmosphere ignition in combination with a lithium or lithium-ion battery thermal runaway process, and the resulting effects on the enclosure. PMID:27695201

  5. Internal short circuit and accelerated rate calorimetry tests of lithium-ion cells: Considerations for methane-air intrinsic safety and explosion proof/flameproof protection methods

    PubMed Central

    Dubaniewicz, Thomas H.; DuCarme, Joseph P.

    2016-01-01

    Researchers with the National Institute for Occupational Safety and Health (NIOSH) studied the potential for lithium-ion cell thermal runaway from an internal short circuit in equipment for use in underground coal mines. In this third phase of the study, researchers compared plastic wedge crush-induced internal short circuit tests of selected lithium-ion cells within methane (CH4)-air mixtures with accelerated rate calorimetry tests of similar cells. Plastic wedge crush test results with metal oxide lithium-ion cells extracted from intrinsically safe evaluated equipment were mixed, with one cell model igniting the chamber atmosphere while another cell model did not. The two cells models exhibited different internal short circuit behaviors. A lithium iron phosphate (LiFePO4) cell model was tolerant to crush-induced internal short circuits within CH4-air, tested under manufacturer recommended charging conditions. Accelerating rate calorimetry tests with similar cells within a nitrogen purged 353-mL chamber produced ignitions that exceeded explosion proof and flameproof enclosure minimum internal pressure design criteria. Ignition pressures within a 20-L chamber with 6.5% CH4-air were relatively low, with much larger head space volume and less adiabatic test conditions. The literature indicates that sizeable lithium thionyl chloride (LiSOCl2) primary (non rechargeable) cell ignitions can be especially violent and toxic. Because ignition of an explosive atmosphere is expected within explosion proof or flameproof enclosures, there is a need to consider the potential for an internal explosive atmosphere ignition in combination with a lithium or lithium-ion battery thermal runaway process, and the resulting effects on the enclosure.

  6. Enhancing Students' Learning Process Through Self-Generated Tests

    NASA Astrophysics Data System (ADS)

    Sanchez-Elez, Marcos; Pardines, Inmaculada; Garcia, Pablo; Miñana, Guadalupe; Roman, Sara; Sanchez, Margarita; Risco, Jose Luis

    2013-03-01

    The use of new technologies in higher education has surprisingly emphasized students' tendency to adopt a passive behavior in class. Participation and interaction of students are essential to improve academic results. This paper describes an educational experiment aimed at the promotion of students' autonomous learning by requiring them to generate test type questions related to the contents of the course. The main idea is to make the student feel part of the evaluation process by including students' questions in the evaluation exams. A set of applications running on our university online learning environment has been developed in order to provide both students and teachers with the necessary tools for a good interaction between them. Questions uploaded by students are visible to every enrolled student as well as to each involved teacher. In this way, we enhance critical analysis skills, by solving and finding possible mistakes in the questions sent by their fellows. The experiment was applied over 769 students from 12 different courses. Results show that the students who have actively participated in the experiment have obtained better academic performance.

  7. A products generator for testing the performance of disassembly procedures

    NASA Astrophysics Data System (ADS)

    Adenso-Díaz, Belarmino; González Torre, Beatriz

    2004-12-01

    In recent decades, regulations and markets have been exerting pressure on designers and manufacturers to take more responsibility for the environmental impacts of their products throughout their life cycles. The problem of finding the disassembly sequence represents one of the major challenges when attempting to close product life cycles by carrying out reuse, recycling and remanufacturing practices. Many different techniques have been used to deal with this problem, varying from exact to heuristic solutions. So far, however, not much effort has gone into measuring and comparing the efficiency of this wide set of techniques. This is partly due to the difficulties of getting a wide population of real products, belonging to different industries and with different degree of complexity that might constitute a representative population for carrying out this kind of task. In this paper, a generator of complex products is presented that is able to build up products with hundreds of components joined by different kinds of joints in such a way that a theoretical "good" disassembly sequence is always known. The efficiency of different methods for general products can thus be easily compared. The performance of a Scatter Search algorithm is tested as an example of its application in this case.

  8. Nanosecond pulsed electric fields (nsPEFs) low cost generator design using power MOSFET and Cockcroft-Walton multiplier circuit as high voltage DC source

    NASA Astrophysics Data System (ADS)

    Sulaeman, M. Y.; Widita, R.

    2014-09-01

    Purpose: Non-ionizing radiation therapy for cancer using pulsed electric field with high intensity field has become an interesting field new research topic. A new method using nanosecond pulsed electric fields (nsPEFs) offers a novel means to treat cancer. Not like the conventional electroporation, nsPEFs able to create nanopores in all membranes of the cell, including membrane in cell organelles, like mitochondria and nucleus. NsPEFs will promote cell death in several cell types, including cancer cell by apoptosis mechanism. NsPEFs will use pulse with intensity of electric field higher than conventional electroporation, between 20-100 kV/cm and with shorter duration of pulse than conventional electroporation. NsPEFs requires a generator to produce high voltage pulse and to achieve high intensity electric field with proper pulse width. However, manufacturing cost for creating generator that generates a high voltage with short duration for nsPEFs purposes is highly expensive. Hence, the aim of this research is to obtain the low cost generator design that is able to produce a high voltage pulse with nanosecond width and will be used for nsPEFs purposes. Method: Cockcroft-Walton multiplier circuit will boost the input of 220 volt AC into high voltage DC around 1500 volt and it will be combined by a series of power MOSFET as a fast switch to obtain a high voltage with nanosecond pulse width. The motivation using Cockcroft-Walton multiplier is to acquire a low-cost high voltage DC generator; it will use capacitors and diodes arranged like a step. Power MOSFET connected in series is used as voltage divider to share the high voltage in order not to damage them. Results: This design is expected to acquire a low-cost generator that can achieve the high voltage pulse in amount of -1.5 kV with falltime 3 ns and risetime 15 ns into a 50Ω load that will be used for nsPEFs purposes. Further detailed on the circuit design will be explained at presentation.

  9. Nanosecond pulsed electric fields (nsPEFs) low cost generator design using power MOSFET and Cockcroft-Walton multiplier circuit as high voltage DC source

    SciTech Connect

    Sulaeman, M. Y.; Widita, R.

    2014-09-30

    Purpose: Non-ionizing radiation therapy for cancer using pulsed electric field with high intensity field has become an interesting field new research topic. A new method using nanosecond pulsed electric fields (nsPEFs) offers a novel means to treat cancer. Not like the conventional electroporation, nsPEFs able to create nanopores in all membranes of the cell, including membrane in cell organelles, like mitochondria and nucleus. NsPEFs will promote cell death in several cell types, including cancer cell by apoptosis mechanism. NsPEFs will use pulse with intensity of electric field higher than conventional electroporation, between 20–100 kV/cm and with shorter duration of pulse than conventional electroporation. NsPEFs requires a generator to produce high voltage pulse and to achieve high intensity electric field with proper pulse width. However, manufacturing cost for creating generator that generates a high voltage with short duration for nsPEFs purposes is highly expensive. Hence, the aim of this research is to obtain the low cost generator design that is able to produce a high voltage pulse with nanosecond width and will be used for nsPEFs purposes. Method: Cockcroft-Walton multiplier circuit will boost the input of 220 volt AC into high voltage DC around 1500 volt and it will be combined by a series of power MOSFET as a fast switch to obtain a high voltage with nanosecond pulse width. The motivation using Cockcroft-Walton multiplier is to acquire a low-cost high voltage DC generator; it will use capacitors and diodes arranged like a step. Power MOSFET connected in series is used as voltage divider to share the high voltage in order not to damage them. Results: This design is expected to acquire a low-cost generator that can achieve the high voltage pulse in amount of −1.5 kV with falltime 3 ns and risetime 15 ns into a 50Ω load that will be used for nsPEFs purposes. Further detailed on the circuit design will be explained at presentation.

  10. GENERIC VERIFICATION PROTOCOL: DISTRIBUTED GENERATION AND COMBINED HEAT AND POWER FIELD TESTING PROTOCOL

    EPA Science Inventory

    This report is a generic verification protocol by which EPA’s Environmental Technology Verification program tests newly developed equipment for distributed generation of electric power, usually micro-turbine generators and internal combustion engine generators. The protocol will ...

  11. A Parallel Genetic Algorithm for Automated Electronic Circuit Design

    NASA Technical Reports Server (NTRS)

    Lohn, Jason D.; Colombano, Silvano P.; Haith, Gary L.; Stassinopoulos, Dimitris; Norvig, Peter (Technical Monitor)

    2000-01-01

    We describe a parallel genetic algorithm (GA) that automatically generates circuit designs using evolutionary search. A circuit-construction programming language is introduced and we show how evolution can generate practical analog circuit designs. Our system allows circuit size (number of devices), circuit topology, and device values to be evolved. We present experimental results as applied to analog filter and amplifier design tasks.

  12. Large Volume Coagulation Utilizing Multiple Cavitation Clouds Generated by Array Transducer Driven by 32 Channel Drive Circuits

    NASA Astrophysics Data System (ADS)

    Nakamura, Kotaro; Asai, Ayumu; Sasaki, Hiroshi; Yoshizawa, Shin; Umemura, Shin-ichiro

    2013-07-01

    High-intensity focused ultrasound (HIFU) treatment is a noninvasive treatment, in which focused ultrasound is generated outside the body and coagulates a diseased tissue. The advantage of this method is minimal physical and mental stress to the patient, and the disadvantage is the long treatment time caused by the smallness of the therapeutic volume by a single exposure. To improve the efficiency and shorten the treatment time, we are focusing attention on utilizing cavitation bubbles. The generated microbubbles can convert the acoustic energy into heat with a high efficiency. In this study, using the class D amplifiers, which we have developed, to drive the array transducer, we demonstrate a new method to coagulate a large volume by a single HIFU exposure through generating cavitation bubbles distributing in a large volume and vibrating all of them. As a result, the coagulated volume by the proposed method was 1.71 times as large as that of the conventional method.

  13. Comparison of photonic integrated circuits for millimeter-wave signal generation between dual-wavelength sources for optical heterodyning and pulsed mode-locked lasers

    NASA Astrophysics Data System (ADS)

    Carpintero, Guillermo; Gordon, Carlos; Guzman, Robinson; Leijtens, Xaveer; Van Dijk, Frédéric; Kervella, Gaël.; Fice, Martyn J.; Balakier, Katarzyna; Renaud, Cyril C.

    2015-03-01

    A comparative study of two different Photonic Integrated Circuits (PICs) structures for continuous-wave generation of millimeter-wave (MMW) signals is presented, each using a different approach. One approach is optical heterodyning, using an integrated dual-wavelength laser source based on Arrayed Waveguide Grating. The other is based on ModeLocked Laser Diodes (MLLDs). A novel building block -Multimode Interference Reflectors (MIRs) - is used to integrate on-chip both structures, without need of cleaved facets to define the laser cavity. This fact enables us to locate any of these structures at any location within the photonic chip. As will be shown, the MLLD structure provides a simple source for low frequencies. Higher frequencies are easier to achieve by optical heterodyne. Both types of structures have been fabricated on a generic foundry in a commercial MPW PIC technology.

  14. Toward next-generation optical networks: a network operator perspective based on experimental tests and economic analysis

    NASA Astrophysics Data System (ADS)

    Xiao, Xiaojun; Du, Chunsheng; Zhou, Rongsheng

    2004-04-01

    As a result of data traffic"s exponential growth, network is currently evolving from fixed circuit switched services to dynamic packet switched services, which has brought unprecedented changes to the existing transport infrastructure. It is generally agreed that automatic switched optical network (ASON) is one of the promising solutions for the next generation optical networks. In this paper, we present the results of our experimental tests and economic analysis on ASON. The intention of this paper is to present our perspective, in terms of evolution strategy toward ASON, on next generation optical networks. It is shown through experimental tests that the performance of current Pre-standard ASON enabled equipments satisfies the basic requirements of network operators and is ready for initial deployment. The results of the economic analysis show that network operators can be benefit from the deployment of ASON from three sides. Firstly, ASON can reduce the CAPEX for network expanding by integrating multiple ADM & DCS into one box. Secondly, ASON can reduce the OPEX for network operation by introducing automatic resource control scheme. Finally, ASON can increase margin revenue by providing new optical network services such as Bandwidth on Demand, optical VPN etc. Finally, the evolution strategy is proposed as our perspective toward next generation optical networks. We hope the evolution strategy introduced may be helpful for the network operators to gracefully migrate their fixed ring based legacy networks to next generation dynamic mesh based network.

  15. Field Testing GEOICE: A Next-Generation Polar Seismometer

    NASA Astrophysics Data System (ADS)

    Beaudoin, B. C.; Winberry, J. P.; Huerta, A. D.; Chung, P.; Parker, T.; Anderson, K. R.; Bilek, S. L.; Carpenter, P.

    2015-12-01

    We report on the development of a new NSF MRI-community supported seismic observatory designed for studies in ice-covered regions - the Geophysical Earth Observatory for Ice Covered Environs (GEOICE). This project is motivated by the need to densify and optimize the collection of high-quality seismic data relevant to key solid Earth and cryosphere science questions. The GEOICE instruments and their power and other ancillary systems are being designed to require minimal installation time and logistical load (i.e., size and weight), while maximizing ease-of-use in the field. The system is capable of advanced data handling and telemetry while being able to withstand conditions associated with icy environments, including cold/wet conditions and high-latitude solar limitations. The instrument capability will include a hybrid seismograph pool of broadband and intermediate elements for observation of both long-period signals (e.g, long-period surface waves and slow sources) and intermediate-to-short-period signals (e.g., teleseismic body waves, local seismicity, and impulsive or extended glaciogenic signals).Key features will include a design that integrates the seismometer and digitizer into a single, environmentally and mechanically robust housing; very low power requirements (~1 watt) for the intermediate-band systems; and advanced power systems that optimize battery capacity and operational limits. The envisioned ~100 element GEOICE instruments will nearly double the current polar inventory of stations and will be maintained and supported at the IRIS PASSCAL Instrument Center to ensure full and flexible peer-reviewed community use. Prototype instruments are currently deployed in Antarctica and Alaska, with a larger Antarctic deployment planned for the 2015-2016 season. The results of these field tests will help to refine instrumentation design and lead to the production of robust and capable next-generation seismic sensors.

  16. Conditional deletion of α-CaMKII impairs integration of adult-generated granule cells into dentate gyrus circuits and hippocampus-dependent learning.

    PubMed

    Arruda-Carvalho, Maithe; Restivo, Leonardo; Guskjolen, Axel; Epp, Jonathan R; Elgersma, Ype; Josselyn, Sheena A; Frankland, Paul W

    2014-09-01

    New granule cells are continuously integrated into hippocampal circuits throughout adulthood, and the fine-tuning of this process is likely important for efficient hippocampal function. During development, this integration process is critically regulated by the α-calcium/calmodulin-dependent protein kinase II (α-CaMKII), and here we ask whether this role is conserved in the adult brain. To do this, we developed a transgenic strategy to conditionally delete α-CaMKII from neural progenitor cells and their progeny in adult mice. First, we found that the selective deletion of α-CaMKII from newly generated dentate granule cells led to an increase in dendritic complexity. Second, α-CaMKII deletion led to a reduction in number of mature synapses and cell survival. Third, consistent with altered morphological and synaptic development, acquisition of one-trial contextual fear conditioning was impaired after deletion of α-CaMKII from newly generated dentate granule cells. Previous work in Xenopus identified α-CaMKII as playing a key role in the stabilization of dendritic and synaptic structure during development. The current study indicates that α-CaMKII plays a plays a similar, cell-autonomous role in the adult hippocampus and, in addition, reveals that the loss of α-CaMKII from adult-generated granule cells is associated with impaired hippocampus-dependent learning.

  17. Monolithic microwave integrated circuits

    NASA Astrophysics Data System (ADS)

    Pucel, R. A.

    Monolithic microwave integrated circuits (MMICs), a new microwave technology which is expected to exert a profound influence on microwave circuit designs for future military systems as well as for the commercial and consumer markets, is discussed. The book contains an historical discussion followed by a comprehensive review presenting the current status in the field. The general topics of the volume are: design considerations, materials and processing considerations, monolithic circuit applications, and CAD, measurement, and packaging techniques. All phases of MMIC technology are covered, from design to testing.

  18. Retrieval Mode Distinguishes the Testing Effect from the Generation Effect

    ERIC Educational Resources Information Center

    Karpicke, Jeffrey D.; Zaromb, Franklin M.

    2010-01-01

    A series of four experiments examined the effects of generation vs. retrieval practice on subsequent retention. Subjects were first exposed to a list of target words. Then the subjects were shown the targets again intact for Read trials or they were shown fragments of the targets. Subjects in Generate conditions were told to complete the fragments…

  19. 3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing.

    PubMed

    Shao, K; Morisset, A; Pouget, V; Faraud, E; Larue, C; Lewis, D; McMorrow, D

    2011-11-01

    We have performed three-dimensional characterization of the TPA effective laser spot size in silicon using an integrated knife-edge sensor. The TPA-induced response of a CMOS integrated circuit is analyzed based on these results and compared to simulation; we have found that the charge injection capacity in IC's active layer could be influenced by irradiance energy and focus depth.

  20. Multi-channel detector readout method and integrated circuit

    DOEpatents

    Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

    2004-05-18

    An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

  1. Multi-channel detector readout method and integrated circuit

    DOEpatents

    Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

    2006-12-12

    An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

  2. A Step Response Based Mixed-Signal BIST Approach for Continuous-time Linear Circuits

    NASA Technical Reports Server (NTRS)

    Walker, Alvernon; Lala, P. K.

    2001-01-01

    A new Mixed-Signal Built-in self-test approach that is based upon the step response of a reconfigurable (or multifunction) analog block is presented in this paper. The technique requires the overlapping step response of the Circuit Under Test (CUT) for two circuit configurations. Each configuration can be realized by changing the topology of the CUT or by sampling two CUT nodes with differing step responses. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) and/or digital-to-analog converter(DAC). It also does not require any precision voltage sources or comparators. This approach does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with the application of the proposed approach to a circuit found in the work of Epstein et al and two ITC 97 analog benchmark circuits.

  3. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Cut-out circuits. 234.269 Section 234.269... circuits. Each cut-out circuit shall be tested at least once every three months to determine that the circuit functions as intended. For purposes of this section, a cut-out circuit is any circuit...

  4. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Cut-out circuits. 234.269 Section 234.269... circuits. Each cut-out circuit shall be tested at least once every three months to determine that the circuit functions as intended. For purposes of this section, a cut-out circuit is any circuit...

  5. Fabrication and In vivo Thrombogenicity Testing of Nitric Oxide Generating Artificial Lungs

    PubMed Central

    Amoako, Kagya A; Montoya, Patrick J; Major, Terry C; Suhaib, Ahmed B; Handa, Hitesh; Brant, David O; Meyerhoff, Mark E; Bartlett, Robert H; Cook, Keith E

    2013-01-01

    Hollow fiber artificial lungs are increasingly being used for long-term applications. However, clot formation limits their use to 1-2 weeks. This study investigated the effect of nitric oxide generating (NOgen) hollow fibers on artificial lung thrombogenicity. Silicone hollow fibers were fabricated to incorporate 50 nm copper particles as a catalyst for NO generation from the blood. Fibers with and without (control) these particles were incorporated into artificial lungs with a 0.1 m2 surface area and inserted in circuits coated tip-to-tip with the NOgen material. Circuits (N=5/each) were attached to rabbits in a pumpless, arterio-venous configuration and run for 4 hrs at an activated clotting time of 350-400s. Three control circuits clotted completely, while none of the NOgen circuits failed. Accordingly, blood flows were significantly higher in the NOgen group (95.9 ± 11.7, p < 0.01) compared to the controls (35.2 ± 19.7) (ml/min), and resistance was significantly higher in the control group after 4 hours (15.38 ± 9.65, p<0.001) than in NOgen (0.09 ± 0.03) (mmHg/mL/min). On the other hand, platelet counts and plasma fibrinogen concentration expressed as percent of baseline in control group (63.7 ± 5.7%, 77.2 ± 5.6% [p<0.05]) were greater than those in the NOgen group (60.4 ± 5.1%, 63.2 ± 3.7%). Plasma copper levels in the NOgen group were 2.8 times baseline at 4 hours (132.8 ± 4.5 μg/dl) and unchanged in the controls. This work demonstrates that NO generating gas exchange fibers could be a potentially effective way to control coagulation inside artificial lungs. PMID:23613156

  6. GATING CIRCUITS

    DOEpatents

    Merrill, L.C.

    1958-10-14

    Control circuits for vacuum tubes are described, and a binary counter having an improved trigger circuit is reported. The salient feature of the binary counter is the application of the input signal to the cathode of each of two vacuum tubes through separate capacitors and the connection of each cathode to ground through separate diodes. The control of the binary counter is achieved in this manner without special pulse shaping of the input signal. A further advantage of the circuit is the simplicity and minimum nuruber of components required, making its use particularly desirable in computer machines.

  7. MULTIPLIER CIRCUIT

    DOEpatents

    Thomas, R.E.

    1959-01-20

    An electronic circuit is presented for automatically computing the product of two selected variables by multiplying the voltage pulses proportional to the variables. The multiplier circuit has a plurality of parallel resistors of predetermined values connected through separate gate circults between a first input and the output terminal. One voltage pulse is applied to thc flrst input while the second voltage pulse is applied to control circuitry for the respective gate circuits. Thc magnitude of the second voltage pulse selects the resistors upon which the first voltage pulse is imprcssed, whereby the resultant output voltage is proportional to the product of the input voltage pulses

  8. A fully enclosed, compact standard lightning impulse generator for testing ultra-high-voltage-class gas-insulated switchgears with high capacitance

    NASA Astrophysics Data System (ADS)

    Wen, Tao; Zhang, Qiaogen; Zhang, Lingli; Zhao, Junping; Liu, Xuandong; Li, Xiaoang; Guo, Can; You, Haoyang; Chen, Weijiang; Yin, Yu; Shi, Weidong

    2016-03-01

    At present, conducting standard lightning impulse (LI) tests in the field for gas-insulated switchgear (GIS) equipment is difficult because of the high capacitance of the test equipment and large circuit inductance of traditional impulse devices, which leads to a wavefront time Tf ≥ 2.5 μs. A novel fully enclosed, compact standard LI generator for testing ultra-high-voltage-class GIS equipment with high capacitance is presented to solve the problem of Tf exceeding the standard during LI voltage tests for actual large-sized equipment. The impulse generator is installed in a metal vessel filled with SF6 or SF6/N2 gas mixture at a pressure of 0.3-0.5 MPa, providing a more compact structure and a lower series inductance. A newly developed conical voltage sensor is used to accurately measure the output voltage waveform. Two test modes (via bushing docking and direct docking) for the GIS test based on the impulse generator are introduced. Calculation results show that the impulse generator can generate an LI test waveform following the present IEC standard for the test of equipment with capacitance >10 000 pF.

  9. A fully enclosed, compact standard lightning impulse generator for testing ultra-high-voltage-class gas-insulated switchgears with high capacitance.

    PubMed

    Wen, Tao; Zhang, Qiaogen; Zhang, Lingli; Zhao, Junping; Liu, Xuandong; Li, Xiaoang; Guo, Can; You, Haoyang; Chen, Weijiang; Yin, Yu; Shi, Weidong

    2016-03-01

    At present, conducting standard lightning impulse (LI) tests in the field for gas-insulated switchgear (GIS) equipment is difficult because of the high capacitance of the test equipment and large circuit inductance of traditional impulse devices, which leads to a wavefront time T(f) ≥ 2.5 μs. A novel fully enclosed, compact standard LI generator for testing ultra-high-voltage-class GIS equipment with high capacitance is presented to solve the problem of T(f) exceeding the standard during LI voltage tests for actual large-sized equipment. The impulse generator is installed in a metal vessel filled with SF6 or SF6/N2 gas mixture at a pressure of 0.3-0.5 MPa, providing a more compact structure and a lower series inductance. A newly developed conical voltage sensor is used to accurately measure the output voltage waveform. Two test modes (via bushing docking and direct docking) for the GIS test based on the impulse generator are introduced. Calculation results show that the impulse generator can generate an LI test waveform following the present IEC standard for the test of equipment with capacitance >10,000 pF. PMID:27036815

  10. A fully enclosed, compact standard lightning impulse generator for testing ultra-high-voltage-class gas-insulated switchgears with high capacitance.

    PubMed

    Wen, Tao; Zhang, Qiaogen; Zhang, Lingli; Zhao, Junping; Liu, Xuandong; Li, Xiaoang; Guo, Can; You, Haoyang; Chen, Weijiang; Yin, Yu; Shi, Weidong

    2016-03-01

    At present, conducting standard lightning impulse (LI) tests in the field for gas-insulated switchgear (GIS) equipment is difficult because of the high capacitance of the test equipment and large circuit inductance of traditional impulse devices, which leads to a wavefront time T(f) ≥ 2.5 μs. A novel fully enclosed, compact standard LI generator for testing ultra-high-voltage-class GIS equipment with high capacitance is presented to solve the problem of T(f) exceeding the standard during LI voltage tests for actual large-sized equipment. The impulse generator is installed in a metal vessel filled with SF6 or SF6/N2 gas mixture at a pressure of 0.3-0.5 MPa, providing a more compact structure and a lower series inductance. A newly developed conical voltage sensor is used to accurately measure the output voltage waveform. Two test modes (via bushing docking and direct docking) for the GIS test based on the impulse generator are introduced. Calculation results show that the impulse generator can generate an LI test waveform following the present IEC standard for the test of equipment with capacitance >10,000 pF.

  11. A Study of Power Systems Stability Enhancement Effects by Excitation Control of Superconducting Generator with High Response Excitation based on Detailed Excitation Circuit Model

    NASA Astrophysics Data System (ADS)

    Wu, Guohong; Shirato, Hideyuki

    SCG (Superconducting Generator) has a superconducting field winding, which leads to many advantages such as small size, high generation efficiency, low impedance, and so on, and be considered as one of the candidates to meet the needs of high stability and high efficiency in the future power system networks. SCG with high response excitation is especially expected to be able to enhance the transient stability of power system by its SMES (Superconducting Magnetic Energy System) effect. The SMES effect of SCG is recognized that its behaviors are dominated by the structures and controls of its excitation system. For this reason, in order to verify exactly how the SMES effect of SCG influences on the power system stability, the electrical circuits of SCG high response excitation are modeled in detail for conducting digital simulation, and its influence on excitation voltage and active power output of SCG are discussed as well. The simulation results with a typical one machine - infinite bus power system model shows that the SMES effect can be certainly obtained when its exciting power is supplied from SCG terminal bus and may considerably lead to an improvement of power system transient stability.

  12. Expanding stress generation theory: test of a transdiagnostic model.

    PubMed

    Conway, Christopher C; Hammen, Constance; Brennan, Patricia A

    2012-08-01

    Originally formulated to understand the recurrence of depressive disorders, the stress generation hypothesis has recently been applied in research on anxiety and externalizing disorders. Results from these investigations, in combination with findings of extensive comorbidity between depression and other mental disorders, suggest the need for an expansion of stress generation models to include the stress generating effects of transdiagnostic pathology as well as those of specific syndromes. Employing latent variable modeling techniques to parse the general and specific elements of commonly co-occurring Axis I syndromes, the current study examined the associations of transdiagnostic internalizing and externalizing dimensions with stressful life events over time. Analyses revealed that, after adjusting for the covariation between the dimensions, internalizing was a significant predictor of interpersonal dependent stress, whereas externalizing was a significant predictor of noninterpersonal dependent stress. Neither latent dimension was associated with the occurrence of independent, or fateful, stressful life events. At the syndrome level, once variance due to the internalizing factor was partialed out, unipolar depression contributed incrementally to the generation of interpersonal dependent stress. In contrast, the presence of panic disorder produced a "stress inhibition" effect, predicting reduced exposure to interpersonal dependent stress. Additionally, dysthymia was associated with an excess of noninterpersonal dependent stress. The latent variable modeling framework used here is discussed in terms of its potential as an integrative model for stress generation research.

  13. Electrical Circuit Tester

    DOEpatents

    Love, Frank

    2006-04-18

    An electrical circuit testing device is provided, comprising a case, a digital voltage level testing circuit with a display means, a switch to initiate measurement using the device, a non-shorting switching means for selecting pre-determined electrical wiring configurations to be tested in an outlet, a terminal block, a five-pole electrical plug mounted on the case surface and a set of adapters that can be used for various multiple-pronged electrical outlet configurations for voltages from 100 600 VAC from 50 100 Hz.

  14. Evaluating the Psychometric Characteristics of Generated Multiple-Choice Test Items

    ERIC Educational Resources Information Center

    Gierl, Mark J.; Lai, Hollis; Pugh, Debra; Touchie, Claire; Boulais, André-Philippe; De Champlain, André

    2016-01-01

    Item development is a time- and resource-intensive process. Automatic item generation integrates cognitive modeling with computer technology to systematically generate test items. To date, however, items generated using cognitive modeling procedures have received limited use in operational testing situations. As a result, the psychometric…

  15. TRIPPING CIRCUIT

    DOEpatents

    Lees, G.W.; McCormick, E.D.

    1962-05-22

    A tripping circuit employing a magnetic amplifier for tripping a reactor in response to power level, period, or instrument failure is described. A reference winding and signal winding are wound in opposite directions on the core. Current from an ion chamber passes through both windings. If the current increases at too fast a rate, a shunt circuit bypasses one or the windings and the amplifier output reverses polarity. (AEC)

  16. 40 CFR 86.1333 - Transient test cycle generation.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... heavy-duty transient engine cycles for Otto-cycle and diesel engines are listed in appendix I((f) (1...) in these listings. (1) To unnormalize rpm, use the following equations: (i) For diesel engines... Otto-cycle engines: ER28AP14.007 Where: Max Test Speed = the maximum test speed as calculated in 40...

  17. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... (CONTINUED) Emission Regulations for New Otto-Cycle and Diesel Heavy-Duty Engines; Gaseous and Particulate... cycles. The heavy-duty transient engine cycles for Otto-cycle and diesel engines are listed in appendix I... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  18. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... (CONTINUED) Emission Regulations for New Otto-Cycle and Diesel Heavy-Duty Engines; Gaseous and Particulate... cycles. The heavy-duty transient engine cycles for Otto-cycle and diesel engines are listed in appendix I... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  19. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... (CONTINUED) Emission Regulations for New Otto-Cycle and Diesel Heavy-Duty Engines; Gaseous and Particulate... cycles. The heavy-duty transient engine cycles for Otto-cycle and diesel engines are listed in appendix I... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  20. 40 CFR 86.1333-2010 - Transient test cycle generation.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... (CONTINUED) Emission Regulations for New Otto-Cycle and Diesel Heavy-Duty Engines; Gaseous and Particulate... cycles. The heavy-duty transient engine cycles for Otto-cycle and diesel engines are listed in appendix I... engines: ER13JY05.001 Where: MaxTestSpeed = the maximum test speed as calculated in 40 CFR part 1065....

  1. The next generation of microbiological testing of poultry

    Technology Transfer Automated Retrieval System (TEKTRAN)

    Microbiological testing of food products is a common practice of food processors to ensure compliance with food safety criteria. Sampling on its own is of limited value, but when applied regularly at different stages of the food chain, microbiology testing can be an integral part of a quality contr...

  2. Towards a Framework for Generating Tests to Satisfy Complex Code Coverage in Java Pathfinder

    NASA Technical Reports Server (NTRS)

    Staats, Matt

    2009-01-01

    We present work on a prototype tool based on the JavaPathfinder (JPF) model checker for automatically generating tests satisfying the MC/DC code coverage criterion. Using the Eclipse IDE, developers and testers can quickly instrument Java source code with JPF annotations covering all MC/DC coverage obligations, and JPF can then be used to automatically generate tests that satisfy these obligations. The prototype extension to JPF enables various tasks useful in automatic test generation to be performed, such as test suite reduction and execution of generated tests.

  3. Computerized reminders for five preventive screening tests: generation of patient-specific letters incorporating physician preferences.

    PubMed Central

    Murphy, D. J.; Gross, R.; Buchanan, J.

    2000-01-01

    Compliance with preventive screening tests is inadequate in the United States. We describe a computer based system for generating reminder letters to patients who may have missed their indicated screening tests because they do not visit a provider regularly or missed their tests despite the fact that they do visit a provider. We started with national recommendations and generated a local consensus for test indications. We then used this set of indications and our electronic record to determine test deficiencies in our pilot pool of 3073 patients. The computer generated customized reminder letters targeting several tests. Physicians chose any patients who should not receive letters. The response rate for fecal occult blood (FOB) testing was 33% compared with an 18% historical compliance rate within the same community. FOB reminders generated improved test compliance. Test execution must be considered when commencing a program of screening test reminders. PMID:11079954

  4. DESIGN, FABRICATION, AND TESTING OF AN ADVANCED, NON-POLLUTING TURBINE DRIVE GAS GENERATOR

    SciTech Connect

    Unknown

    2002-03-31

    The objectives of this report period were to complete the development of the Gas Generator design, which was done; fabricate and test of the non-polluting unique power turbine drive gas Gas Generator, which has been postponed. Focus during this report period has been to complete the brazing and bonding necessary to fabricate the Gas Generator hardware, continue making preparations for fabricating and testing the Gas Generator, and continuing the fabrication of the Gas Generator hardware and ancillary hardware in preparation for the test program. Fabrication is more than 95% complete and is expected to conclude in early May 2002. the test schedule was affected by relocation of the testing to another test supplier. The target test date for hot fire testing is now not earlier than June 15, 2002.

  5. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... SERVICES (CONTINUED) MEDICAL DEVICES EAR, NOSE, AND THROAT DEVICES Diagnostic Devices § 874.1120 Electronic... audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an earphone.... The device minimizes the non-test ear's sensing of test tones and signals being generated for the...

  6. 21 CFR 874.1120 - Electronic noise generator for audiometric testing.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... SERVICES (CONTINUED) MEDICAL DEVICES EAR, NOSE, AND THROAT DEVICES Diagnostic Devices § 874.1120 Electronic... audiometric testing is a device that consists of a swept frequency generator, an amplifier, and an earphone.... The device minimizes the non-test ear's sensing of test tones and signals being generated for the...

  7. BEAT: A Web-Based Boolean Expression Fault-Based Test Case Generation Tool

    ERIC Educational Resources Information Center

    Chen, T. Y.; Grant, D. D.; Lau, M. F.; Ng, S. P.; Vasa, V. R.

    2006-01-01

    BEAT is a Web-based system that generates fault-based test cases from Boolean expressions. It is based on the integration of our several fault-based test case selection strategies. The generated test cases are considered to be fault-based, because they are aiming at the detection of particular faults. For example, when the Boolean expression is in…

  8. Automatically generated acceptance test: A software reliability experiment

    NASA Technical Reports Server (NTRS)

    Protzel, Peter W.

    1988-01-01

    This study presents results of a software reliability experiment investigating the feasibility of a new error detection method. The method can be used as an acceptance test and is solely based on empirical data about the behavior of internal states of a program. The experimental design uses the existing environment of a multi-version experiment previously conducted at the NASA Langley Research Center, in which the launch interceptor problem is used as a model. This allows the controlled experimental investigation of versions with well-known single and multiple faults, and the availability of an oracle permits the determination of the error detection performance of the test. Fault interaction phenomena are observed that have an amplifying effect on the number of error occurrences. Preliminary results indicate that all faults examined so far are detected by the acceptance test. This shows promise for further investigations, and for the employment of this test method on other applications.

  9. Summary of second generation alpha CAM testing performed at Hanford

    SciTech Connect

    Johnson, M.L.; Sisk, D.R.; Goles, R.W.; Swinth, K.L.; Tinker, M.R.; Hickey, E.E.

    1994-05-01

    Pacific Northwest Laboratory and Westinghouse Hanford Company tested six models of commercially available alpha continuous air monitors (CAMs): the Canberra Alpha Sentry, Eberline Alpha 6A-1, Merlin Gerin A-CAM, NE America CAM1A, SAIC/RADeCO Model 452, and Victoreen Model 758. The CAMs were tested for calibration and workmanship, performance in various environments, and human factors for field use.

  10. GMOtrack: generator of cost-effective GMO testing strategies.

    PubMed

    Novak, Petra Krau; Gruden, Kristina; Morisset, Dany; Lavrac, Nada; Stebih, Dejan; Rotter, Ana; Zel, Jana

    2009-01-01

    Commercialization of numerous genetically modified organisms (GMOs) has already been approved worldwide, and several additional GMOs are in the approval process. Many countries have adopted legislation to deal with GMO-related issues such as food safety, environmental concerns, and consumers' right of choice, making GMO traceability a necessity. The growing extent of GMO testing makes it important to study optimal GMO detection and identification strategies. This paper formally defines the problem of routine laboratory-level GMO tracking as a cost optimization problem, thus proposing a shift from "the same strategy for all samples" to "sample-centered GMO testing strategies." An algorithm (GMOtrack) for finding optimal two-phase (screening-identification) testing strategies is proposed. The advantages of cost optimization with increasing GMO presence on the market are demonstrated, showing that optimization approaches to analytic GMO traceability can result in major cost reductions. The optimal testing strategies are laboratory-dependent, as the costs depend on prior probabilities of local GMO presence, which are exemplified on food and feed samples. The proposed GMOtrack approach, publicly available under the terms of the General Public License, can be extended to other domains where complex testing is involved, such as safety and quality assurance in the food supply chain.

  11. GMOtrack: generator of cost-effective GMO testing strategies.

    PubMed

    Novak, Petra Krau; Gruden, Kristina; Morisset, Dany; Lavrac, Nada; Stebih, Dejan; Rotter, Ana; Zel, Jana

    2009-01-01

    Commercialization of numerous genetically modified organisms (GMOs) has already been approved worldwide, and several additional GMOs are in the approval process. Many countries have adopted legislation to deal with GMO-related issues such as food safety, environmental concerns, and consumers' right of choice, making GMO traceability a necessity. The growing extent of GMO testing makes it important to study optimal GMO detection and identification strategies. This paper formally defines the problem of routine laboratory-level GMO tracking as a cost optimization problem, thus proposing a shift from "the same strategy for all samples" to "sample-centered GMO testing strategies." An algorithm (GMOtrack) for finding optimal two-phase (screening-identification) testing strategies is proposed. The advantages of cost optimization with increasing GMO presence on the market are demonstrated, showing that optimization approaches to analytic GMO traceability can result in major cost reductions. The optimal testing strategies are laboratory-dependent, as the costs depend on prior probabilities of local GMO presence, which are exemplified on food and feed samples. The proposed GMOtrack approach, publicly available under the terms of the General Public License, can be extended to other domains where complex testing is involved, such as safety and quality assurance in the food supply chain. PMID:20166592

  12. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 46 Shipping 1 2014-10-01 2014-10-01 false Overcurrent protection and switched circuits. 28.860... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each...

  13. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 46 Shipping 1 2012-10-01 2012-10-01 false Overcurrent protection and switched circuits. 28.860... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each...

  14. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 46 Shipping 1 2011-10-01 2011-10-01 false Overcurrent protection and switched circuits. 28.860... circuits. (a) Each power source must be protected against overcurrent. Overcurrent devices for generators... steering circuit, each circuit must be protected against both overload and short circuit. Each...

  15. NEXT GENERATION LEACHING TESTS FOR EVALUATING LEACHING OF INORGANIC CONSTITUENTS

    EPA Science Inventory

    In the U.S. as in other countries, there is increased interest in using industrial by-products as alternative or secondary materials, helping to conserve virgin or raw materials. The LEAF and associated test methods are being used to develop the source term for leaching or any i...

  16. Receiver Gain Modulation Circuit

    NASA Technical Reports Server (NTRS)

    Jones, Hollis; Racette, Paul; Walker, David; Gu, Dazhen

    2011-01-01

    A receiver gain modulation circuit (RGMC) was developed that modulates the power gain of the output of a radiometer receiver with a test signal. As the radiometer receiver switches between calibration noise references, the test signal is mixed with the calibrated noise and thus produces an ensemble set of measurements from which ensemble statistical analysis can be used to extract statistical information about the test signal. The RGMC is an enabling technology of the ensemble detector. As a key component for achieving ensemble detection and analysis, the RGMC has broad aeronautical and space applications. The RGMC can be used to test and develop new calibration algorithms, for example, to detect gain anomalies, and/or correct for slow drifts that affect climate-quality measurements over an accelerated time scale. A generalized approach to analyzing radiometer system designs yields a mathematical treatment of noise reference measurements in calibration algorithms. By treating the measurements from the different noise references as ensemble samples of the receiver state, i.e. receiver gain, a quantitative description of the non-stationary properties of the underlying receiver fluctuations can be derived. Excellent agreement has been obtained between model calculations and radiometric measurements. The mathematical formulation is equivalent to modulating the gain of a stable receiver with an externally generated signal and is the basis for ensemble detection and analysis (EDA). The concept of generating ensemble data sets using an ensemble detector is similar to the ensemble data sets generated as part of ensemble empirical mode decomposition (EEMD) with exception of a key distinguishing factor. EEMD adds noise to the signal under study whereas EDA mixes the signal with calibrated noise. It is mixing with calibrated noise that permits the measurement of temporal-functional variability of uncertainty in the underlying process. The RGMC permits the evaluation of EDA by

  17. Endurance testing of first generation (Block 1) commercial solar cell modules

    NASA Technical Reports Server (NTRS)

    Anagnostou, E.; Forestieri, A. F.

    1978-01-01

    To determine lifetimes of the first generation (Block 1) commercial solar cell modules used in solar cell arrays, a program was initiated to expose these modules to a range of environments. The conditions endured by these modules encompassed hot and dry, hot and humid, tropical rain forests, sea-air, urban industrial and urban clean. Exposures were for periods up to 1 year. The effect of outdoor exposure on the performance of the modules was determined using current-voltage curves. Short-circuit current (I sub sc) and maximum power (P sub max) were the parameters monitored. In all cases, there was a loss of performance of the modules with outdoor exposure.

  18. Circuit bridging of components by smoke

    SciTech Connect

    Tanaka, T.J.; Nowlen, S.P.; Anderson, D.J.

    1996-10-01

    Smoke can adversely affect digital electronics; in the short term, it can lead to circuit bridging and in the long term to corrosion of metal parts. This report is a summary of the work to date and component-level tests by Sandia National Laboratories for the Nuclear Regulatory Commission to determine the impact of smoke on digital instrumentation and control equipment. The component tests focused on short-term effects such as circuit bridging in typical components and the factors that can influence how much the smoke will affect them. These factors include the component technology and packaging, physical board protection, and environmental conditions such as the amount of smoke, temperature of burn, and humidity level. The likelihood of circuit bridging was tested by measuring leakage currents and converting those currents to resistance in ohms. Hermetically sealed ceramic packages were more resistant to smoke than plastic packages. Coating the boards with an acrylic spray provided some protection against circuit bridging. The smoke generation factors that affect the resistance the most are humidity, fuel level, and burn temperature. The use of CO{sub 2} as a fire suppressant, the presence of galvanic metal, and the presence of PVC did not significantly affect the outcome of these results.

  19. Transcriptional Profiling of Newly Generated Dentate Granule Cells Using TU Tagging Reveals Pattern Shifts in Gene Expression during Circuit Integration1,2

    PubMed Central

    Chatzi, Christina; Shen, Rongkun; Goodman, Richard H.

    2016-01-01

    Abstract Despite representing only a small fraction of hippocampal granule cells, adult-generated newborn granule cells have been implicated in learning and memory (Aimone et al., 2011). Newborn granule cells undergo functional maturation and circuit integration over a period of weeks. However, it is difficult to assess the accompanying gene expression profiles in vivo with high spatial and temporal resolution using traditional methods. Here we used a novel method [“thiouracil (TU) tagging”] to map the profiles of nascent mRNAs in mouse immature newborn granule cells compared with mature granule cells. We targeted a nonmammalian uracil salvage enzyme, uracil phosphoribosyltransferase, to newborn neurons and mature granule cells using retroviral and lentiviral constructs, respectively. Subsequent injection of 4-TU tagged nascent RNAs for analysis by RNA sequencing. Several hundred genes were significantly enhanced in the retroviral dataset compared with the lentiviral dataset. We compared a selection of the enriched genes with steady-state levels of mRNAs using quantitative PCR. Ontology analysis revealed distinct patterns of nascent mRNA expression, with newly generated immature neurons showing enhanced expression for genes involved in synaptic function, and neural differentiation and development, as well as genes not previously associated with granule cell maturation. Surprisingly, the nascent mRNAs enriched in mature cells were related to energy homeostasis and metabolism, presumably indicative of the increased energy demands of synaptic transmission and their complex dendritic architecture. The high spatial and temporal resolution of our modified TU-tagging method provides a foundation for comparison with steady-state RNA analyses by traditional transcriptomic approaches in defining the functional roles of newborn neurons. PMID:27011954

  20. MULTIPLIER CIRCUIT

    DOEpatents

    Chase, R.L.

    1963-05-01

    An electronic fast multiplier circuit utilizing a transistor controlled voltage divider network is presented. The multiplier includes a stepped potentiometer in which solid state or transistor switches are substituted for mechanical wipers in order to obtain electronic switching that is extremely fast as compared to the usual servo-driven mechanical wipers. While this multiplier circuit operates as an approximation and in steps to obtain a voltage that is the product of two input voltages, any desired degree of accuracy can be obtained with the proper number of increments and adjustment of parameters. (AEC)

  1. TID Test Results for 4th Generation iPad(TradeMark)

    NASA Technical Reports Server (NTRS)

    Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A.

    2013-01-01

    TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.

  2. Parametric Analysis of a Hover Test Vehicle using Advanced Test Generation and Data Analysis

    NASA Technical Reports Server (NTRS)

    Gundy-Burlet, Karen; Schumann, Johann; Menzies, Tim; Barrett, Tony

    2009-01-01

    Large complex aerospace systems are generally validated in regions local to anticipated operating points rather than through characterization of the entire feasible operational envelope of the system. This is due to the large parameter space, and complex, highly coupled nonlinear nature of the different systems that contribute to the performance of the aerospace system. We have addressed the factors deterring such an analysis by applying a combination of technologies to the area of flight envelop assessment. We utilize n-factor (2,3) combinatorial parameter variations to limit the number of cases, but still explore important interactions in the parameter space in a systematic fashion. The data generated is automatically analyzed through a combination of unsupervised learning using a Bayesian multivariate clustering technique (AutoBayes) and supervised learning of critical parameter ranges using the machine-learning tool TAR3, a treatment learner. Covariance analysis with scatter plots and likelihood contours are used to visualize correlations between simulation parameters and simulation results, a task that requires tool support, especially for large and complex models. We present results of simulation experiments for a cold-gas-powered hover test vehicle.

  3. CADAT integrated circuit mask analysis

    NASA Technical Reports Server (NTRS)

    1981-01-01

    CADAT System Mask Analysis Program (MAPS2) is automated software tool for analyzing integrated-circuit mask design. Included in MAPS2 functions are artwork verification, device identification, nodal analysis, capacitance calculation, and logic equation generation.

  4. Testing conditions in shock-based contextual fear conditioning influence both the behavioral responses and the activation of circuits potentially involved in contextual avoidance.

    PubMed

    Viellard, Juliette; Baldo, Marcus Vinicius C; Canteras, Newton Sabino

    2016-12-15

    Previous studies from our group have shown that risk assessment behaviors are the primary contextual fear responses to predatory and social threats, whereas freezing is the main contextual fear response to physically harmful events. To test contextual fear responses to a predator or aggressive conspecific threat, we developed a model that involves placing the animal in an apparatus where it can avoid the threat-associated environment. Conversely, in studies that use shock-based fear conditioning, the animals are usually confined inside the conditioning chamber during the contextual fear test. In the present study, we tested shock-based contextual fear responses using two different behavioral testing conditions: confining the animal in the conditioning chamber or placing the animal in an apparatus with free access to the conditioning compartment. Our results showed that during the contextual fear test, the animals confined to the shock chamber exhibited significantly more freezing. In contrast, the animals that could avoid the conditioning compartment displayed almost no freezing and exhibited risk assessment responses (i.e., crouch-sniff and stretch postures) and burying behavior. In addition, the animals that were able to avoid the shock chamber had increased Fos expression in the juxtadorsomedial lateral hypothalamic area, the dorsomedial part of the dorsal premammillary nucleus and the lateral and dorsomedial parts of the periaqueductal gray, which are elements of a septo/hippocampal-hypothalamic-brainstem circuit that is putatively involved in mediating contextual avoidance. Overall, the present findings show that testing conditions significantly influence both behavioral responses and the activation of circuits involved in contextual avoidance. PMID:27544875

  5. Circuit Training.

    ERIC Educational Resources Information Center

    Nelson, Jane B.

    1998-01-01

    Describes a research-based activity for high school physics students in which they build an LC circuit and find its resonant frequency of oscillation using an oscilloscope. Includes a diagram of the apparatus and an explanation of the procedures. (DDR)

  6. DESIGN, FABRICATION, AND TESTING OF AN ADVANCED, NON-POLLUTING TURBINE DRIVE GAS GENERATOR

    SciTech Connect

    E.W. Baxter

    2002-06-30

    The objective of this report period was to continue the development of the Gas Generator design, completion of the hardware and ancillary hardware fabrication and commence the Test Preparations for the testing of the non-polluting unique power turbine driven Gas Generator. Focus during this report period has been on completing the Gas Generator fabrication of hardware and ancillary hardware, and completion of unit closeout brazing and bonding. Because of unacceptable delays encountered in a previously competitively selected test site, CES initiated a re-competition of our testing program and selected an alternate test site. Following that selection, CES used all available resources to make preparations for testing the 10 Mw Gas Generator at the new testing site facilities of NTS at Saugus, CA.

  7. Gas Generation Testing of Neptunium Oxide Generated Using the HB-Line Phase IIFlowsheet

    SciTech Connect

    Duffey, J

    2003-08-29

    The hydrogen (H{sub 2}) gas generation rate for neptunium dioxide (NpO{sub 2}) samples produced on a laboratory scale using the HB-Line Phase II flowsheet has been measured following exposure to 75% relative humidity (RH). As expected, the observed H{sub 2} generation rates for these samples increase with increasing moisture content. A maximum H{sub 2} generation rate of 1.8 x 10{sup -6} moles per day per kilogram (mol {center_dot} day{sup -1} kg{sup -1}) was observed for NpO{sub 2} samples with approximately one and one-half times (1 1/2 X) the expected specific surface area (SSA) for the HB-Line Phase II product. The SSA of NpO{sub 2} samples calcined at 650 C is similar to plutonium dioxide (PuO{sub 2}) calcined at 950 C according to the Department of Energy (DOE) standard for packaging and storage of PuO{sub 2}. This low SSA of the HB-Line Phase II product limits moisture uptake to less than 0.2 weight percent (wt %) even with extended exposure to 75% RH.

  8. CD-ROM Based Multimedia Homework Solutions and Self Test Generator.

    ERIC Educational Resources Information Center

    Rhodes, Jeffrey M.; Bell, Christopher C.

    1998-01-01

    Discusses a prototype multimedia application that was designed to help college students solve problems and generate practice tests for an economics textbook. Highlights include step-by-step problem solving; a friendly interface; student tracking; inexpensive development costs; examples of screen displays; and generating random, scored tests on…

  9. Instructional Topics in Educational Measurement (ITEMS) Module: Using Automated Processes to Generate Test Items

    ERIC Educational Resources Information Center

    Gierl, Mark J.; Lai, Hollis

    2013-01-01

    Changes to the design and development of our educational assessments are resulting in the unprecedented demand for a large and continuous supply of content-specific test items. One way to address this growing demand is with automatic item generation (AIG). AIG is the process of using item models to generate test items with the aid of computer…

  10. Coincident steam generator tube rupture and stuck-open safety relief valve carryover tests: MB-2 steam generator transient response test program

    SciTech Connect

    Garbett, K; Mendler, O J; Gardner, G C; Garnsey, R; Young, M Y

    1987-03-01

    In PWR steam generator tube rupture (SGTR) faults, a direct pathway for the release of radioactive fission products can exist if there is a coincident stuck-open safety relief valve (SORV) or if the safety relief valve is cycled. In addition to the release of fission products from the bulk steam generator water by moisture carryover, there exists the possibility that some primary coolant may be released without having first mixed with the bulk water - a process called primary coolant bypassing. The MB-2 Phase II test program was designed specifically to identify the processes for droplet carryover during SGTR faults and to provide data of sufficient accuracy for use in developing physical models and computer codes to describe activity release. The test program consisted of sixteen separate tests designed to cover a range of steady-state and transient fault conditions. These included a full SGTR/SORV transient simulation, two SGTR overfill tests, ten steady-state SGTR tests at water levels ranging from very low levels in the bundle up to those when the dryer was flooded, and three moisture carryover tests without SGTR. In these tests the influence of break location and the effect of bypassing the dryer were also studied. In a final test the behavior with respect to aerosol particles in a dry steam generator, appropriate to a severe accident fault, was investigated.

  11. Removing Bonded Integrated Circuits From Boards

    NASA Technical Reports Server (NTRS)

    Rice, John T.

    1989-01-01

    Small resistance heater makes it easier, faster, and cheaper to remove integrated circuit from hybrid-circuit board, package, or other substrate for rework. Heater, located directly in polymeric bond interface or on substrate under integrated-circuit chip, energized when necessary to remove chip. Heat generated softens adhesive or solder that bonds chip to substrate. Chip then lifted easily from substrate.

  12. Electrifying Inquiry: Electrical Circuits

    ERIC Educational Resources Information Center

    Godbey, Susan; Barnett, Jessica; Webster, Lois

    2005-01-01

    An activity involving parallel electrical circuits was modified to incorporate an open inquiry approach. Both the original and revised versions of the activity were tested in the middle school classroom. We present a comparison of the two versions of the activity in terms of facilitating learning and engaging students' interests.

  13. Alternatives Generation and Analysis for Lower Knuckle Ultrasonic Testing Technology

    SciTech Connect

    WOLFF, J.J.

    2001-02-21

    Environmental regulations applicable to the River Protection Project require integrity assessment of the double-shell tank (DST) system. In the early 1990s a strategy and plans were developed to conduct the required tank system examinations and integrity assessments. This included plans to conduct ultrasonic testing of six DSTs. In 1997, an ad hoc committee (Tank Structural Integrity Panel, TSIP) working under the direction of the Office of Environmental Restoration and Waste Management, U.S. Department of Energy, published guidelines for managing risks associated with aging degradation of high level waste storage tanks. This included recommendations on non-destructive examination of specific regions of tanks. For the lower knuckle region, defined as the curved transition from the vertical portion of the tank wall to the flat portion of the tank bottom, the TSIP guidelines contained the following recommendation: ''Examine the lower knuckle region including 5% of the length of the upper weld, at least 2.5% of the area of the predicted maximum stress region of the knuckle base metal and 2.5% of the lower weld if accessible. Emphasis should be on weld/HAZ cracking such as SCC. If the lower weld is not accessible, one-square-foot sections whose length adds up to 5% of the circumference of the knuckle base metal shall be examined.'' Also in 1997, the U.S. Department of Energy and Washington Department of Ecology formalized an agreement on the DST system integrity assessment work scope required to satisfy the applicable regulatory requirements. This cited the TSIP guidelines, and included an agreement to conduct ultrasonic examination on six representative DSTs for determination and extent of cracks, corrosion, and pitting.

  14. Automatic Generation of Rasch-Calibrated Items: Figural Matrices Test GEOM and Endless-Loops Test EC

    ERIC Educational Resources Information Center

    Arendasy, Martin

    2005-01-01

    The future of test construction for certain psychological ability domains that can be analyzed well in a structured manner may lie--at the very least for reasons of test security--in the field of automatic item generation. In this context, a question that has not been explicitly addressed is whether it is possible to embed an item response theory…

  15. Tests of the radiation hardness of VLSI Integrated Circuits and Silicon Strip Detectors for the SSC (Superconducting Super Collider) under neutron, proton, and gamma irradiation

    SciTech Connect

    Ziock, H.J.; Milner, C.; Sommer, W.F. ); Carteglia, N.; DeWitt, J.; Dorfan, D.; Hubbard, B.; Leslie, J.; O'Shaughnessy, K.F.; Pitzl, D.; Rowe, W.A.; Sadrozinski, H.F.W.; Seiden, A.; Spencer, E. . Inst. for Particle Physics); Ellison, J.A. ); Ferguson, P. ); Giubellino

    1990-01-01

    As part of a program to develop a silicon strip central tracking detector system for the Superconducting Super Collider (SSC) we are studying the effects of radiation damage in silicon detectors and their associated front-end readout electronics. We report on the results of neutron and proton irradiations at the Los Alamos National Laboratory (LANL) and {gamma}-ray irradiations at UC Santa Cruz (UCSC). Individual components on single-sided AC-coupled silicon strip detectors and on test structures were tested. Circuits fabricated in a radiation hard CMOS process and individual transistors fabricated using dielectric isolation bipolar technology were also studied. Results indicate that a silicon strip tracking detector system should have a lifetime of at least one decade at the SSC. 17 refs., 17 figs.

  16. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be tested at least once every three months to determine that the circuit functions as intended. For...

  17. 49 CFR 234.269 - Cut-out circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Cut-out circuits. 234.269 Section 234.269..., Inspection, and Testing Inspections and Tests § 234.269 Cut-out circuits. Each cut-out circuit shall be tested at least once every three months to determine that the circuit functions as intended. For...

  18. A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning

    NASA Astrophysics Data System (ADS)

    Gu, Peipei; Niu, Zhendong; Chen, Xuting; Chen, Wei

    2013-03-01

    In recent years, computer-based testing has become an effective method to evaluate students' overall learning progress so that appropriate guiding strategies can be recommended. Research has been done to develop intelligent test assembling systems which can automatically generate test sheets based on given parameters of test items. A good multisubject test sheet depends on not only the quality of the test items but also the construction of the sheet. Effective and efficient construction of test sheets according to multiple subjects and criteria is a challenging problem. In this paper, a multi-subject test sheet generation problem is formulated and a test sheet generating approach based on intelligent genetic algorithm and hierarchical planning (GAHP) is proposed to tackle this problem. The proposed approach utilizes hierarchical planning to simplify the multi-subject testing problem and adopts genetic algorithm to process the layered criteria, enabling the construction of good test sheets according to multiple test item requirements. Experiments are conducted and the results show that the proposed approach is capable of effectively generating multi-subject test sheets that meet specified requirements and achieve good performance.

  19. A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning

    NASA Astrophysics Data System (ADS)

    Gu, Peipei; Niu, Zhendong; Chen, Xuting; Chen, Wei

    2012-04-01

    In recent years, computer-based testing has become an effective method to evaluate students' overall learning progress so that appropriate guiding strategies can be recommended. Research has been done to develop intelligent test assembling systems which can automatically generate test sheets based on given parameters of test items. A good multisubject test sheet depends on not only the quality of the test items but also the construction of the sheet. Effective and efficient construction of test sheets according to multiple subjects and criteria is a challenging problem. In this paper, a multi-subject test sheet generation problem is formulated and a test sheet generating approach based on intelligent genetic algorithm and hierarchical planning (GAHP) is proposed to tackle this problem. The proposed approach utilizes hierarchical planning to simplify the multi-subject testing problem and adopts genetic algorithm to process the layered criteria, enabling the construction of good test sheets according to multiple test item requirements. Experiments are conducted and the results show that the proposed approach is capable of effectively generating multi-subject test sheets that meet specified requirements and achieve good performance.

  20. Design study of piezoelectric energy-harvesting devices for generation of higher electrical power using a coupled piezoelectric-circuit finite element method.

    PubMed

    Zhu, Meiling; Worthington, Emma; Tiwari, Ashutosh

    2010-01-01

    This paper presents a design study on the geometric parameters of a cantilever-based piezoelectric energy-harvesting devices (EHD), which harvest energy from motion (vibration), for the purpose of scavenging more energy from ambient vibration energy sources. The design study is based on the coupled piezoelectric-circuit finite element method (CPCFEM), previously presented by Dr. Zhu. This model can calculate the power output of piezoelectric EHDS directly connected to a load resistor and is used in this paper to obtain the following simulation results for variations in geometric parameters such as the beam length, width and thickness, and the mass length, width, and height: 1) the current flowing through and the voltage developed across the load resistor, 2) the power dissipated by the resistor and the corresponding vibrational displacement amplitude, and 3) the resonant frequency. By studying these results, straightforward design strategies that enable the generation of more power are obtained for each geometric parameter, and a physical understanding of how each parameter affects the output power is given. It is suggested that, in designing with the aim of generating more power, the following strategies be used: 1) for the beam, a shorter length, larger width, and lower ratio of piezoelectric layer thickness to total beam thickness are preferred in the case of a fixed mass; 2) for the mass, a shortened mass length and a higher mass height are preferred in the case of variation in the mass length and the mass height with mass width and mass value remain fixed, and a wider width and small mass height are preferred in the case of variation in mass width and height (mass length and value remain fixed; and 3) for the case of a fixed total length, a shorter beam length and longer mass length are preferred. With the design strategies, output powers from the device can reach above 1 to 2 mW/cm(3), much higher than the 200 microW/cm(3) currently achieved in the published