Science.gov

Sample records for circuit test generation

  1. Generating circuit tests by exploiting designed behavior

    NASA Astrophysics Data System (ADS)

    Shirley, Mark H.

    1988-12-01

    Generating tests for sequential devices is one of the hardest problems in designing and manufacturing digital circuits. This task is difficult primarily because internal components are accessible only indirectly, forcing a test generator to use the surrounding components collectively as a probe for detecting faults. This in turn forces the test generator to reason about complex interactions between the behaviors of these surrounding components. Current automated solutions are becoming ineffective as designs grow larger and more complex. Yet, despite the complexity, human experts remain remarkably successful, in part, because they use knowledge from many sources and use a variety of reasoning techniques. This thesis exploits several kinds of expert knowledge about circuits and test generation not used by the current algorithms. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently for sequential circuits that provide few operations at their interfaces by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are a more readable and compact representation for tests than vectors are. Test programs can be constructed automatically by merging test program fragments using expert supplied goal-refined rules and domain independent planning techniques from artificial intelligence.

  2. Generating Circuit Tests by Exploiting Designed Behavior

    DTIC Science & Technology

    1988-12-01

    determine whether the circuit is in test-mode and control /AR shifting. We modified the circuit model accordingly. Figure 6.16 shows the consequences for...productive. Yehudah Freundlich opened my mind to the history and philosophy of science. He knows lots of pretty good jokes too. Glenn Kramer, Narinder...39 2.2 Modeling Circuits and Faults ...... ...................... 44 2.2.1 Circuit Models

  3. Test pattern generation for ILA sequential circuits

    NASA Technical Reports Server (NTRS)

    Feng, YU; Frenzel, James F.; Maki, Gary K.

    1993-01-01

    An efficient method of generating test patterns for sequential machines implemented using one-dimensional, unilateral, iterative logic arrays (ILA's) of BTS pass transistor networks is presented. Based on a transistor level fault model, the method affords a unique opportunity for real-time fault detection with improved fault coverage. The resulting test sets are shown to be equivalent to those obtained using conventional gate level models, thus eliminating the need for additional test patterns. The proposed method advances the simplicity and ease of the test pattern generation for a special class of sequential circuitry.

  4. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, E.I. Jr.; Peterson, K.A.; Barton, D.L.

    1998-07-14

    An electron beam apparatus and method for testing a circuit are disclosed. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 {micro}m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits. 7 figs.

  5. Capacitive charge generation apparatus and method for testing circuits

    DOEpatents

    Cole, Jr., Edward I.; Peterson, Kenneth A.; Barton, Daniel L.

    1998-01-01

    An electron beam apparatus and method for testing a circuit. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 .mu.m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits.

  6. FSM test: A functional test generation system for sequential circuits

    NASA Astrophysics Data System (ADS)

    Fummi, Franco

    1993-03-01

    An approach to test pattern generation for Finite State Machines (FSM's) and the relationships with their gate level implementation is presented. The algorithm is based on a functional fault model. A restricted set of transitions of the FSM is analyzed and particular state distinguishing sequences (EUIO's) are adopted to observe their final state. Overlapping and concatenation of test sequences is performed in order to reduce test length. Test length obtained is in most cases shorter than previously published functional approaches and the CPU (Central Processing Unit) time requirements are very low in comparison with the gate level ATPG's. Some polynomial complexity preserving techniques are introduced in order to improve the final fault coverage. A number of experiments on MCNC benchmarks have shown the effectiveness of the test algorithm both at the functional level and at the gate level, where the coverage of single stuck-at faults in most cases achieves 100.

  7. Functional test generation for digital circuits described with a declarative language: LUSTRE

    NASA Astrophysics Data System (ADS)

    Almahrous, Mazen

    1990-08-01

    A functional approach to the test generation problem starting from a high level description is proposed. The circuit tested is modeled, using the LUSTRE high level data flow description language. The different LUSTRE primitives are translated to a SATAN format graph in order to evaluate the testability of the circuit and to generate test sequences. Another method of testing the complex circuits comprising an operative part and a control part is defined. It consists of checking experiments for the control part observed through the operative part. It was applied to the automata generated from a LUSTRE description of the circuit.

  8. IRIS (Integrity and Reliability in Integrated Circuits) Test Article Generation (ITAG)

    DTIC Science & Technology

    2015-03-31

    P’\\1 USC Viterbi ~ School of Engineering IRIS ( Integrity and Reliability in Inte- grated Circuits ) Test Article Generation (ITAG) Final Report...SUBTITLE 5a. CONTRACTNUMBER IRIS ( Integrity and Reliability in Integrated Circuits ) Test Article Generation (!TAG) HR00 11 - 11-C -004l 5b. GRANT...lifespan of these components. DARPA’s Microelectronics Technology Office established the Integrity and Reliability in Integrated Circuits (IRIS

  9. Integrated circuit test-port architecture and method and apparatus of test-port generation

    DOEpatents

    Teifel, John

    2016-04-12

    A method and apparatus are provided for generating RTL code for a test-port interface of an integrated circuit. In an embodiment, a test-port table is provided as input data. A computer automatically parses the test-port table into data structures and analyzes it to determine input, output, local, and output-enable port names. The computer generates address-detect and test-enable logic constructed from combinational functions. The computer generates one-hot multiplexer logic for at least some of the output ports. The one-hot multiplexer logic for each port is generated so as to enable the port to toggle between data signals and test signals. The computer then completes the generation of the RTL code.

  10. Generator circuit breaker retrofit

    SciTech Connect

    Dayton, L.P.

    1995-12-31

    This paper will discuss the economic considerations, the development from concept to installation, benefits realized and the operational history of the generator circuit breaker retrofit project at Wanapum and Priest Rapids Dams, Grant County Public Utility District, Washington.

  11. Trigger Circuit for Marx Generators

    DTIC Science & Technology

    2001-02-08

    A trigger circuit is provided for a trigger system for a Marx generator column. The column includes a plurality of metal electrode pairs wherein the...electrode (trigatron) spark gap switch forming the first spark gap of the Marx generator column. The triggering circuit includes a trigger

  12. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1990-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  13. Integrated circuit reliability testing

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Sayah, Hoshyar R. (Inventor)

    1988-01-01

    A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

  14. Multifunctional pattern-generating circuits.

    PubMed

    Briggman, K L; Kristan, W B

    2008-01-01

    The ability of distinct anatomical circuits to generate multiple behavioral patterns is widespread among vertebrate and invertebrate species. These multifunctional neuronal circuits are the result of multistable neural dynamics and modular organization. The evidence suggests multifunctional circuits can be classified by distinct architectures, yet the activity patterns of individual neurons involved in more than one behavior can vary dramatically. Several mechanisms, including sensory input, the parallel activity of projection neurons, neuromodulation, and biomechanics, are responsible for the switching between patterns. Recent advances in both analytical and experimental tools have aided the study of these complex circuits.

  15. A Library of Modular Routines for Generating Test Patterns for Digital Circuits

    DTIC Science & Technology

    1988-01-01

    arguement on the command line determines which implementation is executed (i.e., "dalg" for the D-algorithm, "podem" for PODEM, or "fan" for the...implementation of FAN). The second arguement -a the command line is the name of the input file containing the circuit description and the list of target...the fault is " aborted ") or the fault is determined to be redundant, the appropriate message is also written to this file. 5.4 Data Structures The

  16. State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume IV. Test Generation.

    DTIC Science & Technology

    1982-10-01

    containing 240 gates and 36 flip-flops [Hill & Huey 1977]. It 13 S tart aults Fault (1)-AgorithmI (2) Sensitization Searchj o. , ye F nauls no -- - Delet...Conf., Cherry Hill, NJ, pp. 37-41, October 1979. [Lesser & Shedletsky 1980] J.D. Lesser & J.J. Shedletsky: "An experimental delay test generator for...patterns within a structured sequential logic network," Digest Semiconductor Test Symp., Cherry Hill, NJ, pp. 19-27, October 1977. [Yamada et al. 1977

  17. Designing Test Chips for Custom Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G.; Griswold, T. W.; Pina, C. A.; Timoc, C. C.

    1985-01-01

    Collection of design and testing procedures partly automates development of built-in test chips for CMOS integrated circuits. Testchip methodology intended especially for users of custom integratedcircuit wafers. Test-Chip Designs and Testing Procedures (including datareduction procedures) generated automatically by computer from programed design and testing rules and from information supplied by user.

  18. Fault localization when testing complex circuits

    NASA Astrophysics Data System (ADS)

    Velazco, Raoul

    An approach to state functional diagnoses when testing complex integrated circuits is presented. The test environment is described. The tester is monitored by a computer which manages test sequencing. The test programs produced by the GAPT (French acronym for automatic generation of test programs) generators may be used to state a functional diagnosis, when testing microprocessors. In some cases, it may help in finding design or manufacturing faults. The test programs generated by GAPT are used as go/no go test programs. Significant experiments, using the so called a posteriori approach were carried out, with regard to simple testing and design validation of a second source 68000, with a view to comparing the second source circuit with the original one. The test system is currently used to test a sample of Intel 8086 microprocessors, which will be implemented in a space environment.

  19. Integrated-Circuit Pseudorandom-Number Generator

    NASA Technical Reports Server (NTRS)

    Steelman, James E.; Beasley, Jeff; Aragon, Michael; Ramirez, Francisco; Summers, Kenneth L.; Knoebel, Arthur

    1992-01-01

    Integrated circuit produces 8-bit pseudorandom numbers from specified probability distribution, at rate of 10 MHz. Use of Boolean logic, circuit implements pseudorandom-number-generating algorithm. Circuit includes eight 12-bit pseudorandom-number generators, outputs are uniformly distributed. 8-bit pseudorandom numbers satisfying specified nonuniform probability distribution are generated by processing uniformly distributed outputs of eight 12-bit pseudorandom-number generators through "pipeline" of D flip-flops, comparators, and memories implementing conditional probabilities on zeros and ones.

  20. Development of automated test procedures and techniques for LSI circuits

    NASA Technical Reports Server (NTRS)

    Carroll, B. D.

    1975-01-01

    Testing of large scale integrated (LSI) logic circuits was considered from the point of view of automatic test pattern generation. A system for automatic test pattern generation is described. A test generation algorithm is presented that can be applied to both combinational and sequential logic circuits. Also included is a programmed implementation of the algorithm and sample results from the program.

  1. Chain Of Test Contacts For Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Lieneweg, Udo

    1989-01-01

    Test structure forms chain of "cross" contacts fabricated together with large-scale integrated circuits. If necessary, number of such chains incorporated at suitable locations in integrated-circuit wafer for determination of fabrication yield of contacts. In new structure, resistances of individual contacts determined: In addition to making it possible to identify local defects, enables generation of statistical distributions of contact resistances for prediction of "parametric" contact yield of fabrication process.

  2. Generating neural circuits that implement probabilistic reasoning

    NASA Astrophysics Data System (ADS)

    Barber, M. J.; Clark, J. W.; Anderson, C. H.

    2003-10-01

    We extend the hypothesis that neuronal populations represent and process analog variables in terms of probability density functions (PDFs). Aided by an intermediate representation of the probability density based on orthogonal functions spanning an underlying low-dimensional function space, it is shown how neural circuits may be generated from Bayesian belief networks. The ideas and the formalism of this PDF approach are illustrated and tested with several elementary examples, and in particular through a problem in which model-driven top-down information flow influences the processing of bottom-up sensory input.

  3. Automatic Parametric Testing Of Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Jennings, Glenn A.; Pina, Cesar A.

    1989-01-01

    Computer program for parametric testing saves time and effort in research and development of integrated circuits. Software system automatically assembles various types of test structures and lays them out on silicon chip, generates sequency of test instructions, and interprets test data. Employs self-programming software; needs minimum of human intervention. Adapted to needs of different laboratories and readily accommodates new test structures. Program codes designed to be adaptable to most computers and test equipment now in use. Written in high-level languages to enhance transportability.

  4. BLOCKING OSCILLATOR DOUBLE PULSE GENERATOR CIRCUIT

    DOEpatents

    Haase, J.A.

    1961-01-24

    A double-pulse generator, particuiarly a double-pulse generator comprising a blocking oscillator utilizing a feedback circuit to provide means for producing a second pulse within the recovery time of the blocking oscillator, is described. The invention utilized a passive network which permits adjustment of the spacing between the original pulses derived from the blocking oscillator and further utilizes the original pulses to trigger a circuit from which other pulses are initiated. These other pulses are delayed and then applied to the input of the blocking oscillator, with the result that the output from the oscillator circuit contains twice the number of pulses originally initiated by the blocking oscillator itself.

  5. Submicrosecond Power-Switching Test Circuit

    NASA Technical Reports Server (NTRS)

    Folk, Eric N.

    2006-01-01

    A circuit that changes an electrical load in a switching time shorter than 0.3 microsecond has been devised. This circuit can be used in testing the regulation characteristics of power-supply circuits . especially switching power-converter circuits that are supposed to be able to provide acceptably high degrees of regulation in response to rapid load transients. The combination of this power-switching circuit and a known passive constant load could be an attractive alternative to a typical commercially available load-bank circuit that can be made to operate in nominal constant-voltage, constant-current, and constant-resistance modes. The switching provided by a typical commercial load-bank circuit in the constant-resistance mode is not fast enough for testing of regulation in response to load transients. Moreover, some test engineers do not trust the test results obtained when using commercial load-bank circuits because the dynamic responses of those circuits are, variously, partly unknown and/or excessively complex. In contrast, the combination of this circuit and a passive constant load offers both rapid switching and known (or at least better known) load dynamics. The power-switching circuit (see figure) includes a signal-input section, a wide-hysteresis Schmitt trigger that prevents false triggering in the event of switch-contact bounce, a dual-bipolar-transistor power stage that drives the gate of a metal oxide semiconductor field-effect transistor (MOSFET), and the MOSFET, which is the output device that performs the switching of the load. The MOSFET in the specific version of the circuit shown in the figure is rated to stand off a potential of 100 V in the "off" state and to pass a current of 20 A in the "on" state. The switching time of this circuit (the characteristic time of rise or fall of the potential at the drain of the MOSFET) is .300 ns. The circuit can accept any of three control inputs . which one depending on the test that one seeks to perform: a

  6. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  7. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  8. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  9. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  10. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  11. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  12. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  13. 30 CFR 56.6407 - Circuit testing.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit testing. 56.6407 Section 56.6407... Blasting § 56.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test each of the following: (a) Continuity of each electric detonator...

  14. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  15. 30 CFR 57.6407 - Circuit testing.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit testing. 57.6407 Section 57.6407... Blasting-Surface and Underground § 57.6407 Circuit testing. A blasting galvanometer or other instrument designed for testing blasting circuits shall be used to test the following: (a) In surface operations—...

  16. Electronic test and calibration circuits, a compilation

    NASA Technical Reports Server (NTRS)

    1972-01-01

    A wide variety of simple test calibration circuits are compiled for the engineer and laboratory technician. The majority of circuits were found inexpensive to assemble. Testing electronic devices and components, instrument and system test, calibration and reference circuits, and simple test procedures are presented.

  17. Intersecting circuits generate precisely patterned retinal waves.

    PubMed

    Akrouh, Alejandro; Kerschensteiner, Daniel

    2013-07-24

    The developing retina generates spontaneous glutamatergic (stage III) waves of activity that sequentially recruit neighboring ganglion cells with opposite light responses (ON and OFF RGCs). This activity pattern is thought to help establish parallel ON and OFF pathways in downstream visual areas. The circuits that produce stage III waves and desynchronize ON and OFF RGC firing remain obscure. Using dual patch-clamp recordings, we find that ON and OFF RGCs receive sequential excitatory input from ON and OFF cone bipolar cells (CBCs), respectively. This input sequence is generated by crossover circuits, in which ON CBCs control glutamate release from OFF CBCs via diffusely stratified inhibitory amacrine cells. In addition, neighboring ON CBCs communicate directly and indirectly through lateral glutamatergic transmission and gap junctions, both of which are required for wave initiation and propagation. Thus, intersecting lateral excitatory and vertical inhibitory circuits give rise to precisely patterned stage III retinal waves.

  18. Movement generation with circuits of spiking neurons.

    PubMed

    Joshi, Prashant; Maass, Wolfgang

    2005-08-01

    How can complex movements that take hundreds of milliseconds be generated by stereotypical neural microcircuits consisting of spiking neurons with a much faster dynamics? We show that linear readouts from generic neural microcircuit models can be trained to generate basic arm movements. Such movement generation is independent of the arm model used and the type of feedback that the circuit receives. We demonstrate this by considering two different models of a two-jointed arm, a standard model from robotics and a standard model from biology, that each generates different kinds of feedback. Feedback that arrives with biologically realistic delays of 50 to 280 ms turns out to give rise to the best performance. If a feedback with such desirable delay is not available, the neural microcircuit model also achieves good performance if it uses internally generated estimates of such feedback. Existing methods for movement generation in robotics that take the particular dynamics of sensors and actuators into account (embodiment of motor systems) are taken one step further with this approach, which provides methods for also using the embodiment of motion generation circuitry, that is, the inherent dynamics and spatial structure of neural circuits, for the generation of movement.

  19. Memristive Sisyphus circuit for clock signal generation

    PubMed Central

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-01-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets. PMID:27199243

  20. Memristive Sisyphus circuit for clock signal generation

    NASA Astrophysics Data System (ADS)

    Pershin, Yuriy V.; Shevchenko, Sergey N.; Nori, Franco

    2016-05-01

    Frequency generators are widely used in electronics. Here, we report the design and experimental realization of a memristive frequency generator employing a unique combination of only digital logic gates, a single-supply voltage and a realistic thresholdtype memristive device. In our circuit, the oscillator frequency and duty cycle are defined by the switching characteristics of the memristive device and external resistors. We demonstrate the circuit operation both experimentally, using a memristor emulator, and theoretically, using a model memristive device with threshold. Importantly, nanoscale realizations of memristive devices offer small-size alternatives to conventional quartz-based oscillators. In addition, the suggested approach can be used for mimicking some cyclic (Sisyphus) processes in nature, such as “dripping ants” or drops from leaky faucets.

  1. Generating single microwave photons in a circuit.

    PubMed

    Houck, A A; Schuster, D I; Gambetta, J M; Schreier, J A; Johnson, B R; Chow, J M; Frunzio, L; Majer, J; Devoret, M H; Girvin, S M; Schoelkopf, R J

    2007-09-20

    Microwaves have widespread use in classical communication technologies, from long-distance broadcasts to short-distance signals within a computer chip. Like all forms of light, microwaves, even those guided by the wires of an integrated circuit, consist of discrete photons. To enable quantum communication between distant parts of a quantum computer, the signals must also be quantum, consisting of single photons, for example. However, conventional sources can generate only classical light, not single photons. One way to realize a single-photon source is to collect the fluorescence of a single atom. Early experiments measured the quantum nature of continuous radiation, and further advances allowed triggered sources of photons on demand. To allow efficient photon collection, emitters are typically placed inside optical or microwave cavities, but these sources are difficult to employ for quantum communication on wires within an integrated circuit. Here we demonstrate an on-chip, on-demand single-photon source, where the microwave photons are injected into a wire with high efficiency and spectral purity. This is accomplished in a circuit quantum electrodynamics architecture, with a microwave transmission line cavity that enhances the spontaneous emission of a single superconducting qubit. When the qubit spontaneously emits, the generated photon acts as a flying qubit, transmitting the quantum information across a chip. We perform tomography of both the qubit and the emitted photons, clearly showing that both the quantum phase and amplitude are transferred during the emission. Both the average power and voltage of the photon source are characterized to verify performance of the system. This single-photon source is an important addition to a rapidly growing toolbox for quantum optics on a chip.

  2. Next-generation integrated microfluidic circuits.

    PubMed

    Mosadegh, Bobak; Bersano-Begey, Tommaso; Park, Joong Yull; Burns, Mark A; Takayama, Shuichi

    2011-09-07

    This mini-review provides a brief overview of recent devices that use networks of elastomeric valves to minimize or eliminate the need for interconnections between microfluidic chips and external instruction lines that send flow control signals. Conventional microfluidic control mechanisms convey instruction signals in a parallel manner such that the number of instruction lines must increase as the number of independently operated valves increases. The devices described here circumvent this "tyranny of microfluidic interconnects" by the serial encoding of information to enable instruction of an arbitrary number of independent valves with a set number of control lines, or by the microfluidic circuit-embedded encoding of instructions to eliminate control lines altogether. Because the parallel instruction chips are the most historical and straightforward to design, they are still the most commonly used approach today. As requirements for instruction complexity, chip-to-chip communication, and real-time on-chip feedback flow control arise, the next generation of integrated microfluidic circuits will need to incorporate these latest interconnect flow control approaches.

  3. Periodic binary sequence generators: VLSI circuits considerations

    NASA Technical Reports Server (NTRS)

    Perlman, M.

    1984-01-01

    Feedback shift registers are efficient periodic binary sequence generators. Polynomials of degree r over a Galois field characteristic 2(GF(2)) characterize the behavior of shift registers with linear logic feedback. The algorithmic determination of the trinomial of lowest degree, when it exists, that contains a given irreducible polynomial over GF(2) as a factor is presented. This corresponds to embedding the behavior of an r-stage shift register with linear logic feedback into that of an n-stage shift register with a single two-input modulo 2 summer (i.e., Exclusive-OR gate) in its feedback. This leads to Very Large Scale Integrated (VLSI) circuit architecture of maximal regularity (i.e., identical cells) with intercell communications serialized to a maximal degree.

  4. Test chip assembler and test program generator

    NASA Technical Reports Server (NTRS)

    Pina, C. A.

    1985-01-01

    One of the major problems in working at the geometry level for the generation of either test structure or functional circuit designs is the amount of labor involved in the design phase. To reduce the amount of labor involved in both the design and test of the structures used, JPL has developed a design and test program consisting of a Test Chip Assembler (TCA) and a Test Program Generator (TPG), which creates the geometrical description of the structures and generates the necessary test information using a high-level language. This system reduces the design time for a test chip by a factor of 30. To analyze the data obtained from wafer probing, a statistical package called STMJPL was developed. Some of the capabilities of the JPL software (STMJPL) are described.

  5. The carrier-generating analysis of MEMS gyroscope interface circuit

    NASA Astrophysics Data System (ADS)

    Yuan, GuangMin; Yuan, Weizheng; Zhu, Xiaobo; Chang, HongLong

    2014-03-01

    In this paper, the main factors which influence the noise ratio of gyroscope output signal were analysed, according to the MEMS gyro interface circuit technology. A working principle of a carrier in the gyroscope circuit was discussed, the process formula of the carrier amplitude and frequency in the interface circuit of modulation and demodulation was deduced, and the error components lead-in from carrier to gyroscope circuit was distinguished. Several commonly used carrier-generating circuit schemes were analysed and compared, and a carrier-generating program in the interface circuits of the micro-gyroscope was designed, which was applied in a MEMS gyro developed by our laboratory. The measurement results show that the amplitude stability and frequency stability is 1.3 ppm and 12 ppm, respectively, meeting the performance requirements of carrier generating in the MEMS gyro circuit.

  6. Lithium Circuit Test Section Design and Fabrication

    SciTech Connect

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-20

    The Early Flight Fission -- Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  7. Lithium Circuit Test Section Design and Fabrication

    NASA Astrophysics Data System (ADS)

    Godfroy, Thomas; Garber, Anne; Martin, James

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

  8. Lithium Circuit Test Section Design and Fabrication

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas; Garber, Anne

    2006-01-01

    The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper will discuss the overall system design and build and the component testing findings.

  9. Power density improvement of the power conditioning circuit for combined piezoelectric and electrodynamic generators

    NASA Astrophysics Data System (ADS)

    Zessin, H.; Spies, P.; Mateu, L.

    2016-11-01

    In this study, we report a power management circuit for a combined piezoelectric- electrodynamic generator. A piezoelectric element is bonded to a spring steel cantilever beam and a magnet, used as tip mass, oscillates through a coil. This principle creates the combined generator. A test setup has been created to automate the characterization of the piezoelectric generator and its power management circuit. Three different power management circuits for the piezoelectric part of the combined generator have been analysed: a bridge rectifier, an SSHI circuit with an external inductance and an SSHI circuit which utilizes the coil of the electrodynamic generator as circuit element. The three circuits are compared in terms of their output power, efficiency and power density. The SSHI circuit with an external inductance has the highest output power and efficiency, followed by the SSHI circuit with the electrodynamic generator coil. The power density of the bridge rectifier is the highest but for higher efficiency the power density of the SSHI circuit with the coil of the electromagnetic generator reaches the best results.

  10. Test Structures For Bumpy Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.; Sayah, Hoshyar R.

    1989-01-01

    Cross-bridge resistors added to comb and serpentine patterns. Improved combination of test structures built into integrated circuit used to evaluate design rules, fabrication processes, and quality of interconnections. Consist of meshing serpentines and combs, and cross bridge. Structures used to make electrical measurements revealing defects in design or fabrication. Combination of test structures includes three comb arrays, two serpentine arrays, and cross bridge. Made of aluminum or polycrystalline silicon, depending on material in integrated-circuit layers evaluated. Aluminum combs and serpentine arrays deposited over steps made by polycrystalline silicon and diffusion layers, while polycrystalline silicon versions of these structures used to cross over steps made by thick oxide layer.

  11. Generating Weighted Test Patterns for VLSI Chips

    NASA Technical Reports Server (NTRS)

    Siavoshi, Fardad

    1990-01-01

    Improved built-in self-testing circuitry for very-large-scale integrated (VLSI) digital circuits based on version of weighted-test-pattern-generation concept, in which ones and zeros in pseudorandom test patterns occur with probabilities weighted to enhance detection of certain kinds of faults. Requires fewer test patterns and less computation time and occupies less area on circuit chips. Easy to relate switching activity in outputs with fault-detection activity by use of probabilistic fault-detection techniques.

  12. Synthesizing genetic sequential logic circuit with clock pulse generator.

    PubMed

    Chuang, Chia-Hua; Lin, Chun-Liang

    2014-05-28

    Rhythmic clock widely occurs in biological systems which controls several aspects of cell physiology. For the different cell types, it is supplied with various rhythmic frequencies. How to synthesize a specific clock signal is a preliminary but a necessary step to further development of a biological computer in the future. This paper presents a genetic sequential logic circuit with a clock pulse generator based on a synthesized genetic oscillator, which generates a consecutive clock signal whose frequency is an inverse integer multiple to that of the genetic oscillator. An analogous electronic waveform-shaping circuit is constructed by a series of genetic buffers to shape logic high/low levels of an oscillation input in a basic sinusoidal cycle and generate a pulse-width-modulated (PWM) output with various duty cycles. By controlling the threshold level of the genetic buffer, a genetic clock pulse signal with its frequency consistent to the genetic oscillator is synthesized. A synchronous genetic counter circuit based on the topology of the digital sequential logic circuit is triggered by the clock pulse to synthesize the clock signal with an inverse multiple frequency to the genetic oscillator. The function acts like a frequency divider in electronic circuits which plays a key role in the sequential logic circuit with specific operational frequency. A cascaded genetic logic circuit generating clock pulse signals is proposed. Based on analogous implement of digital sequential logic circuits, genetic sequential logic circuits can be constructed by the proposed approach to generate various clock signals from an oscillation signal.

  13. Testing of the anemometer circuit: Data report

    NASA Technical Reports Server (NTRS)

    Moen, Michael J.

    1992-01-01

    The following text discusses results from the electronic step testing and the beginning of velocity step testing in the shock tube. It should be kept in mind that frequency response is always measured as the time from the beginning of the event to the minimum (positive inflection) of the 'bucket' that immediately follows the response. This report is not a complete account of the results from square wave testing. Some data is still in the process of being analyzed and efforts are being made to fit the data to both Freymuth's third order theory and modelled responses from SPICE circuit simulation software.

  14. Development, Integration and Testing of Automated Triggering Circuit for Hybrid DC Circuit Breaker

    NASA Astrophysics Data System (ADS)

    Kanabar, Deven; Roy, Swati; Dodiya, Chiragkumar; Pradhan, Subrata

    2017-04-01

    A novel concept of Hybrid DC circuit breaker having combination of mechanical switch and static switch provides arc-less current commutation into the dump resistor during quench in superconducting magnet operation. The triggering of mechanical and static switches in Hybrid DC breaker can be automatized which can effectively reduce the overall current commutation time of hybrid DC circuit breaker and make the operation independent of opening time of mechanical switch. With this view, a dedicated control circuit (auto-triggering circuit) has been developed which can decide the timing and pulse duration for mechanical switch as well as static switch from the operating parameters. This circuit has been tested with dummy parameters and thereafter integrated with the actual test set up of hybrid DC circuit breaker. This paper deals with the conceptual design of the auto-triggering circuit, its control logic and operation. The test results of Hybrid DC circuit breaker using this circuit have also been discussed.

  15. FRONTAL VIEW OF #3 GENERATOR, 6600 VOLT OIL CIRCUIT BREAKER, ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    FRONTAL VIEW OF #3 GENERATOR, 6600 VOLT OIL CIRCUIT BREAKER, LOCATED BEHIND SLATE SWITCHBOARD. PHOTO BY JET LOWE, HAER, 1995. - Elwha River Hydroelectric System, Elwha Hydroelectric Dam & Plant, Port Angeles, Clallam County, WA

  16. Automatic Test Program Generation.

    DTIC Science & Technology

    1978-03-01

    presents a test description language, NOPAL , in which a user may describe diagnostic tests, and a software system which automatically generates test...programs for an automatic test equipment based on the descriptions of tests. The software system accepts as input the tests specified in NOPAL , performs

  17. Generating three-qubit quantum circuits with neural networks

    NASA Astrophysics Data System (ADS)

    Swaddle, Michael; Noakes, Lyle; Smallbone, Harry; Salter, Liam; Wang, Jingbo

    2017-10-01

    A new method for compiling quantum algorithms is proposed and tested for a three qubit system. The proposed method is to decompose a unitary matrix U, into a product of simpler Uj via a neural network. These Uj can then be decomposed into product of known quantum gates. Key to the effectiveness of this approach is the restriction of the set of training data generated to paths which approximate minimal normal subRiemannian geodesics, as this removes unnecessary redundancy and ensures the products are unique. The two neural networks are shown to work effectively, each individually returning low loss values on validation data after relatively short training periods. The two networks are able to return coefficients that are sufficiently close to the true coefficient values to validate this method as an approach for generating quantum circuits. There is scope for more work in scaling this approach for larger quantum systems.

  18. Testing Fixture For Microwave Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert; Shalkhauser, Kurt

    1989-01-01

    Testing fixture facilitates radio-frequency characterization of microwave and millimeter-wave integrated circuits. Includes base onto which two cosine-tapered ridge waveguide-to-microstrip transitions fastened. Length and profile of taper determined analytically to provide maximum bandwidth and minimum insertion loss. Each cosine taper provides transformation from high impedance of waveguide to characteristic impedance of microstrip. Used in conjunction with automatic network analyzer to provide user with deembedded scattering parameters of device under test. Operates from 26.5 to 40.0 GHz, but operation extends to much higher frequencies.

  19. Testing Fixture For Microwave Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert; Shalkhauser, Kurt

    1989-01-01

    Testing fixture facilitates radio-frequency characterization of microwave and millimeter-wave integrated circuits. Includes base onto which two cosine-tapered ridge waveguide-to-microstrip transitions fastened. Length and profile of taper determined analytically to provide maximum bandwidth and minimum insertion loss. Each cosine taper provides transformation from high impedance of waveguide to characteristic impedance of microstrip. Used in conjunction with automatic network analyzer to provide user with deembedded scattering parameters of device under test. Operates from 26.5 to 40.0 GHz, but operation extends to much higher frequencies.

  20. Operational Characteristics of an SCR-Based Pulse Generating Circuit

    DTIC Science & Technology

    2014-12-01

    of the SCR in such a. circuit was investigated and the values of load resistance and capacitance varied to ascertain their role on the pulse-generat...circuit was investigated and the values of load resistance and capacitance varied to ascertain their role on the pulse-generating capability of the...19 A. REVERSE CURRENT OBSERVATIONS DURING SWITCHING .......19 B. EFFECT OF CAPACITANCE ON PULSING

  1. Entangled Coherent States Generation in two Superconducting LC Circuits

    SciTech Connect

    Chen Meiyu; Zhang Weimin

    2008-11-07

    We proposed a novel pure electronic (solid state) device consisting of two superconducting LC circuits coupled to a superconducting flux qubit. The entangled coherent states of the two LC modes is generated through the measurement of the flux qubit states. The interaction of the flux qubit and two LC circuits is controlled by the external microwave control lines. The geometrical structure of the LC circuits is adjustable and makes a strong coupling between them achievable. This entangled coherent state generator can be realized by using the conventional microelectronic fabrication techniques which increases the feasibility of the experiment.

  2. Starter/generator testing

    NASA Astrophysics Data System (ADS)

    Anon

    1994-10-01

    Sundstrand Aerospace and GE Aircraft Engines have studied the switched reluctance machine for use as an integral starter/generator for future aircraft engines. They have conducted an initial, low-power testing of the starter/generator, which is based on power inverters using IGBT-technology semiconductors, to verify its feasibility in the externally mounted version of the integral starter/generator. This preliminary testing of the 250-kW starter/generator reveals favorable results.

  3. Synthesizing genetic sequential logic circuit with clock pulse generator

    PubMed Central

    2014-01-01

    Background Rhythmic clock widely occurs in biological systems which controls several aspects of cell physiology. For the different cell types, it is supplied with various rhythmic frequencies. How to synthesize a specific clock signal is a preliminary but a necessary step to further development of a biological computer in the future. Results This paper presents a genetic sequential logic circuit with a clock pulse generator based on a synthesized genetic oscillator, which generates a consecutive clock signal whose frequency is an inverse integer multiple to that of the genetic oscillator. An analogous electronic waveform-shaping circuit is constructed by a series of genetic buffers to shape logic high/low levels of an oscillation input in a basic sinusoidal cycle and generate a pulse-width-modulated (PWM) output with various duty cycles. By controlling the threshold level of the genetic buffer, a genetic clock pulse signal with its frequency consistent to the genetic oscillator is synthesized. A synchronous genetic counter circuit based on the topology of the digital sequential logic circuit is triggered by the clock pulse to synthesize the clock signal with an inverse multiple frequency to the genetic oscillator. The function acts like a frequency divider in electronic circuits which plays a key role in the sequential logic circuit with specific operational frequency. Conclusions A cascaded genetic logic circuit generating clock pulse signals is proposed. Based on analogous implement of digital sequential logic circuits, genetic sequential logic circuits can be constructed by the proposed approach to generate various clock signals from an oscillation signal. PMID:24884665

  4. Fastrac Gas Generator Testing

    NASA Technical Reports Server (NTRS)

    Nesman, Tomas E.; Dennis, Jay

    2001-01-01

    A rocket engine gas generator component development test was recently conducted at the Marshall Space Flight Center. This gas generator is intended to power a rocket engine turbopump by the combustion of Lox and RP-1. The testing demonstrated design requirements for start sequence, wall compatibility, performance, and stable combustion. During testing the gas generator injector was modified to improve distribution of outer wall coolant and the igniter boss was modified to investigate the use of a pyrotechnic igniter. Expected chamber pressure oscillations at longitudinal acoustic mode were measured for three different chamber lengths tested. High amplitude discrete oscillations resulted in the chamber-alone configurations when chamber acoustic modes coupled with feed-system acoustics modes. For the full gas generator configuration, which included a turbine inlet manifold, high amplitude oscillations occurred only at off-design very low power levels. This testing led to a successful gas generator design for the Fastrac 60,000 lb thrust engine.

  5. RF arbitrary waveform generation using tunable planar lightwave circuits

    NASA Astrophysics Data System (ADS)

    Samadi, P.; Chen, L. R.; Callender, C.; Dumais, P.; Jacob, S.; Celo, D.

    2011-07-01

    We demonstrate photonically-assisted generation of RF arbitrary waveforms using planar lightwave circuits (PLCs) fabricated on silica-on-silicon. We exploit thermo-optic effects in silica in order to tune the response of the PLC and hence reconfigure the generated waveform. We demonstrate the generation of pulse trains at 40 GHz and 80 GHz with flat-top, Gaussian, and apodized profiles. These results demonstrate the potential for RF arbitrary waveform generation using chip-scale photonic solutions.

  6. Novel Power Conditioning Circuits for Piezoelectric Micro Power Generators

    DTIC Science & Technology

    2003-10-31

    heat engine power generator [14]….………………. 7 1.6. Block diagram of a linear regulator……………………………………………. 7 1.7. Block diagram of a PWM switch...October 31, 2003. Title: Novel Power Conditioning Circuits for Piezoelectric Micro Power Generators . Abstract Approved...von Jouanne Advanced low power devices promote the development of micro power generators (MPGs) to

  7. Development of a circuit breaker for large generators. Final report

    SciTech Connect

    Garzon, R.D.; Wu, J.L.

    1982-01-01

    This report deals with the evaluation of design concepts for the development of Circuit Breakers for large generators and attempts to define a rating structure for a generator circuit breaker. It includes studies on the influence of the system upon the performance of the circuit breaker. This study covers: The harmonic content in the fault current, the absence of current zeros, the influence of the dynamics of the generator shaft upon the current, and the magnitude and characteristics of the inherent transient recovery voltage produced by the system. Design requirements such as storage volumes, operating pressures and size of nozzle's orifice are identified for SF/sub 6/ synchronous and non synchronous interrupters of the axial flow type. The concept of a current limiting generator circuit breaker is introduced and two variations of a current limiting element are evaluated. One of the concepts uses liquid metal (NaK 78) as the current limiting element, and the other considers the use of a frangible conductor. The preliminary results obtained with an experimental model of a NaK device shows that a magnetic pinching effect reduces the time required for the initiation of the liquid metal vaporization which determines the onset of current limitation and shows that the NaK device appears to offer promise for the development of a current limiting generator breaker.

  8. Reduced circuit implementation of encoder and syndrome generator

    SciTech Connect

    Trager, Barry M; Winograd, Shmuel

    2014-05-27

    An error correction method and system includes an Encoder and Syndrome-generator that operate in parallel to reduce the amount of circuitry used to compute check symbols and syndromes for error correcting codes. The system and method computes the contributions to the syndromes and check symbols 1 bit at a time instead of 1 symbol at a time. As a result, the even syndromes can be computed as powers of the odd syndromes. Further, the system assigns symbol addresses so that there are, for an example GF(2.sup.8) which has 72 symbols, three (3) blocks of addresses which differ by a cube root of unity to allow the data symbols to be combined for reducing size and complexity of odd syndrome circuits. Further, the implementation circuit for generating check symbols is derived from syndrome circuit using the inverse of the part of the syndrome matrix for check locations.

  9. Equivalent circuit and characteristic simulation of a brushless electrically excited synchronous wind power generator

    NASA Astrophysics Data System (ADS)

    Wang, Hao; Zhang, Fengge; Guan, Tao; Yu, Siyang

    2017-09-01

    A brushless electrically excited synchronous generator (BEESG) with a hybrid rotor is a novel electrically excited synchronous generator. The BEESG proposed in this paper is composed of a conventional stator with two different sets of windings with different pole numbers, and a hybrid rotor with powerful coupling capacity. The pole number of the rotor is different from those of the stator windings. Thus, an analysis method different from that applied to conventional generators should be applied to the BEESG. In view of this problem, the equivalent circuit and electromagnetic torque expression of the BEESG are derived on the basis of electromagnetic relation of the proposed generator. The generator is simulated and tested experimentally using the established equivalent circuit model. The experimental and simulation data are then analyzed and compared. Results show the validity of the equivalent circuit model.

  10. The neural circuits that generate tics in Tourette's syndrome.

    PubMed

    Wang, Zhishun; Maia, Tiago V; Marsh, Rachel; Colibazzi, Tiziano; Gerber, Andrew; Peterson, Bradley S

    2011-12-01

    The purpose of this study was to examine neural activity and connectivity within cortico-striato-thalamo-cortical circuits and to reveal circuit-based neural mechanisms that govern tic generation in Tourette's syndrome. Functional magnetic resonance imaging data were acquired from 13 individuals with Tourette's syndrome and 21 healthy comparison subjects during spontaneous or simulated tics. Independent component analysis with hierarchical partner matching was used to isolate neural activity within functionally distinct regions of cortico-striato-thalamo-cortical circuits. Granger causality was used to investigate causal interactions among these regions. The Tourette's syndrome group exhibited stronger neural activity and interregional causality than healthy comparison subjects throughout all portions of the motor pathway, including the sensorimotor cortex, putamen, pallidum, and substantia nigra. Activity in these areas correlated positively with the severity of tic symptoms. Activity within the Tourette's syndrome group was stronger during spontaneous tics than during voluntary tics in the somatosensory and posterior parietal cortices, putamen, and amygdala/hippocampus complex, suggesting that activity in these regions may represent features of the premonitory urges that generate spontaneous tic behaviors. In contrast, activity was weaker in the Tourette's syndrome group than in the healthy comparison group within portions of cortico-striato-thalamo-cortical circuits that exert top-down control over motor pathways (the caudate and anterior cingulate cortex), and progressively less activity in these regions accompanied more severe tic symptoms, suggesting that faulty activity in these circuits may result in their failure to control tic behaviors or the premonitory urges that generate them. Our findings, taken together, suggest that tics are caused by the combined effects of excessive activity in motor pathways and reduced activation in control portions of cortico

  11. Classical Ising model test for quantum circuits

    NASA Astrophysics Data System (ADS)

    Geraci, Joseph; Lidar, Daniel A.

    2010-07-01

    We exploit a recently constructed mapping between quantum circuits and graphs in order to prove that circuits corresponding to certain planar graphs can be efficiently simulated classically. The proof uses an expression for the Ising model partition function in terms of quadratically signed weight enumerators (QWGTs), which are polynomials that arise naturally in an expansion of quantum circuits in terms of rotations involving Pauli matrices. We combine this expression with a known efficient classical algorithm for the Ising partition function of any planar graph in the absence of an external magnetic field, and the Robertson-Seymour theorem from graph theory. We give as an example a set of quantum circuits with a small number of non-nearest-neighbor gates which admit an efficient classical simulation.

  12. Test results for SEU and SEL immune memory circuits

    NASA Technical Reports Server (NTRS)

    Wiseman, D.; Canaris, J.; Whitaker, S.; Gambles, J.; Arave, K.; Arave, L.

    1993-01-01

    Test results for three SEU logic/circuit hardened CMOS memory circuits verify upset and latch-up immunity for two configurations to be in excess of 120 MeV cm(exp 2)/mg using a commercial, non-radiation hardened CMOS process. Test chips from three separate fabrication runs in two different process were evaluated.

  13. A Canonical Circuit for Generating Phase-Amplitude Coupling

    PubMed Central

    Onslow, Angela C. E.; Jones, Matthew W.; Bogacz, Rafal

    2014-01-01

    ‘Phase amplitude coupling’ (PAC) in oscillatory neural activity describes a phenomenon whereby the amplitude of higher frequency activity is modulated by the phase of lower frequency activity. Such coupled oscillatory activity – also referred to as ‘cross-frequency coupling’ or ‘nested rhythms’ – has been shown to occur in a number of brain regions and at behaviorally relevant time points during cognitive tasks; this suggests functional relevance, but the circuit mechanisms of PAC generation remain unclear. In this paper we present a model of a canonical circuit for generating PAC activity, showing how interconnected excitatory and inhibitory neural populations can be periodically shifted in to and out of oscillatory firing patterns by afferent drive, hence generating higher frequency oscillations phase-locked to a lower frequency, oscillating input signal. Since many brain regions contain mutually connected excitatory-inhibitory populations receiving oscillatory input, the simplicity of the mechanism generating PAC in such networks may explain the ubiquity of PAC across diverse neural systems and behaviors. Analytic treatment of this circuit as a nonlinear dynamical system demonstrates how connection strengths and inputs to the populations can be varied in order to change the extent and nature of PAC activity, importantly which phase of the lower frequency rhythm the higher frequency activity is locked to. Consequently, this model can inform attempts to associate distinct types of PAC with different network topologies and physiologies in real data. PMID:25136855

  14. Calorimeter Preamplifier Hybrid Circuit Test Jig

    SciTech Connect

    Abraham, B.M.; /Fermilab

    1999-04-19

    There are two ways in which the testing may be initiated, remotely or locally. If the remote operation is desired, an external TTL level signal must be provided to the test jig with the remotellocal switch on the side of the test jig switched to remote. A logic high will initiate the test. A logic low will terminate the test. In the event that an external signal is connected to the test jig while local operation occurs, the local control takes precedence over remote control. Once a DVT has been locked in the ZIF socket and the DIP switches are selected, the Push-to-Test button may be depressed. Momentarily depressing the button will initiate a test with a minimum 400 ms duration. At the same time a PBCLOCK and PBLATCH pulses will be initiated and the power rails +12V, +8V, and -6V will be ramped to full voltage. The time at which the power rails reach the full voltage is about 13 ms and it is synchronized with bypass capacitors placed on COMP input of U20 and U22 and on the output of U23 voltage regulators. The voltage rails are supplied to a {+-}10% window comparator. A red LED indicates the rail is below or above 10% of the design value. A green LED indicates the rail is within acceptable limits. For DDT with a 5 pF and 10 pF feed back capacitor, the +12V and +8V rails are current-regulated to 19rnA and 22 rnA respectively and the -6V rail is short-circuit protected within the regulator. For DUT with a 22 pF feed back capacitor the current regulation is the same as above except that the +8V rail is current regulated to 43 rnA. The power rails are supplied to the DUT via a 10 {Omega} resistor. The voltage drop across this resistor is sensed by a differential amplifier AD620 and amplified by a gain of 10. An external BNC connection is provided from this point to allow for current measurements by the vendor. The current value for each rail is calculated by measuring the voltage value at this point and divided by (10*10{Omega}). The next stage inverts and amplifies

  15. Test Diagnostics of RF Effects in Integrated Circuits

    DTIC Science & Technology

    1990-02-01

    RADC-TR-89-355 Final Technical Report February 1990AD-A219 737 TEST DIAGNOSTICS OF RF EFFECTS IN INTEGRATED CIRCUITS Martin Marietta Space Systems...DIAGNOSTICS OF RF EFFECTS IN INTEGRATED CIRCUITS 12 PERSONAL AUTHOR(S) David D. Wilson, Stan Epshtein, Mark G. Rossi, Christine L. Proffitt 13a. TYPE...presents "he results of an effort to measure the RF upset susceptibilities of CMOS and low power Schottky integrated circuits and to demonstrate a

  16. Optimum magnetic circuit configurations for permanent magnet aerospace generators

    NASA Astrophysics Data System (ADS)

    Amaratunga, G. A. J.; Acarnley, P. P.; McLaren, P. G.

    1985-03-01

    In the design of generators for aerospace applications, it is crucial that the specific output power (power/volume) is as high as possible. In such cases, other factors are relatively minor considerations. As specific output increases with operating speed, many aerospace generators operate at speeds in excess of 12,000 rev/min. Brush wear problems at high speeds, lead to the selection of the permanent magnet (pm) field alternator, which does not use brushes. This alternator has bipolar flux variation in the stator iron and so can be expected to have a high specific output. Magnetic circuit configurations for pm generators are related to radial-field, axial-field, and flux-switching types. The choice of the magnetic circuit configuration is a vital element of the design process. The present paper has the objective to provide for the first time quantitative comparisons of the specific output available from each of several magnetic circuit configurations. It is found that the flux-squeezing configuration has advantages for small sizes.

  17. Generation of optical vortices in an integrated optical circuit

    NASA Astrophysics Data System (ADS)

    Tudor, Rebeca; Kusko, Mihai; Kusko, Cristian

    2017-09-01

    In this work, the generation of optical vortices in an optical integrated circuit is numerically demonstrated. The optical vortices with topological charge m = ±1 are obtained by the coherent superposition of the first order modes present in a waveguide with a rectangular cross section, where the phase delay between these two propagating modes is Δφ = ±π/2. The optical integrated circuit consists of an input waveguide continued with a y-splitter. The left and the right arms of the splitter form two coupling regions K1 and K2 with a multimode output waveguide. In each coupling region, the fundamental modes present in the arms of the splitter are selectively coupled into the output waveguide horizontal and vertical first order modes, respectively. We showed by employing the beam propagation method simulations that the fine tuning of the geometrical parameters of the optical circuit makes possible the generation of optical vortices in both transverse electric (TE) and transverse magnetic (TM) modes. Also, we demonstrated that by placing a thermo-optical element on one of the y-splitter arms, it is possible to switch the topological charge of the generated vortex from m = 1 to m = -1.

  18. Electrical short circuit and current overload tests on aircraft wiring

    NASA Technical Reports Server (NTRS)

    Cahill, Patricia

    1995-01-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  19. Electrical short circuit and current overload tests on aircraft wiring

    NASA Astrophysics Data System (ADS)

    Cahill, Patricia

    1995-11-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  20. Circuit design considerations for regulating energy generated by dielectric elastomer generators

    NASA Astrophysics Data System (ADS)

    Lo, Ho Cheong; Mckay, Thomas; O'Brien, Benjamin M.; Calius, Emilio; Anderson, Iain

    2011-04-01

    Dielectric Elastomer Generator(s) (DEG) have many unique properties that give them advantages over conventional electromagnetic generators. These include the ability to effectively generate power from slow and irregular motions, low cost, relatively large energy density, and a soft and flexible nature. For DEG to generate usable electrical energy circuits for charging (or priming) the stretched DEG and regulating the generated energy when relaxed are required. Most prior art has focused on the priming challenge, and there is currently very little work into developing circuits that address design issues for extracting the electrical energy and converting it into a usable form such as low DC voltages (~10 V) for small batteries or AC mains voltage (~100 V). This paper provides a brief introduction to the problems of regulating the energy generated by DEG. A buck converter and a charge pump are common DC-DC step-down circuits and are used as case studies to explore the design issues inherent in converting the high voltage energy into a form suitable for charging a battery. Buck converters are efficient and reliable but also heavy and bulky, making them suitable for large scale power generation. The smaller and simpler charge pump, though a less effective energy harvester, is better for small and discrete power generation. Future development in miniature DE fabrication is expected to reduce the high operational voltages, simplifying the design of these circuits.

  1. Generating Effective Models and Parameters for RNA Genetic Circuits.

    PubMed

    Hu, Chelsea Y; Varner, Jeffrey D; Lucks, Julius B

    2015-08-21

    RNA genetic circuitry is emerging as a powerful tool to control gene expression. However, little work has been done to create a theoretical foundation for RNA circuit design. A prerequisite to this is a quantitative modeling framework that accurately describes the dynamics of RNA circuits. In this work, we develop an ordinary differential equation model of transcriptional RNA genetic circuitry, using an RNA cascade as a test case. We show that parameter sensitivity analysis can be used to design a set of four simple experiments that can be performed in parallel using rapid cell-free transcription-translation (TX-TL) reactions to determine the 13 parameters of the model. The resulting model accurately recapitulates the dynamic behavior of the cascade, and can be easily extended to predict the function of new cascade variants that utilize new elements with limited additional characterization experiments. Interestingly, we show that inconsistencies between model predictions and experiments led to the model-guided discovery of a previously unknown maturation step required for RNA regulator function. We also determine circuit parameters in two different batches of TX-TL, and show that batch-to-batch variation can be attributed to differences in parameters that are directly related to the concentrations of core gene expression machinery. We anticipate the RNA circuit models developed here will inform the creation of computer aided genetic circuit design tools that can incorporate the growing number of RNA regulators, and that the parametrization method will find use in determining functional parameters of a broad array of natural and synthetic regulatory systems.

  2. [Leak test for the internal circuit of anesthesia machines].

    PubMed

    Tokumine, J; Iha, H; Okuda, Y

    1999-05-01

    In spite of detailed periodic inspection performed by specialized engineers, a great number of anesthesia machines fail to meet the standard of low flow leak test because of leak in the internal circuit. To find out the background and the solution to the problem, we sent questionnaire to 11 major manufacturers and/or dealers each responsible for periodic inspection of anesthetic machines. According to the responses to the questionnaire, the manufacturers and/or the dealers had various methods of internal circuit leak test without a unified standard in detail. The mismatch of the test methods with those anesthesia machines equipped with check valve mechanism has also led to poor evaluation of internal circuit leak. Leak test must be standardized for its appropriate application to work effectively for the problem of leak in the internal circuit of anesthesia machines.

  3. Test and inspection for process control of monolithic circuits

    NASA Technical Reports Server (NTRS)

    Spangenberg, E.

    1967-01-01

    Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation.

  4. Documentation of Stainless Steel Lithium Circuit Test Section Design. Suppl

    NASA Technical Reports Server (NTRS)

    Godfroy, Thomas J. (Compiler); Martin, James J.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations

  5. Documentation of Stainless Steel Lithium Circuit Test Section Design

    NASA Technical Reports Server (NTRS)

    Godfroy, T. J.; Martin, J. J.; Stewart, E. T.; Rhys, N. O.

    2010-01-01

    The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.

  6. On testing stuck-open faults in CMOS combinational circuits

    NASA Technical Reports Server (NTRS)

    Chandramouli, R.

    1982-01-01

    Recently it has been found that a class of failure related to a particular technology (CMOS) cannot be modelled as the conventional stuck-at fault model. These failures change the combinational behavior of CMOS logic gates into a sequential one. Such a failure is modelled as a fault, called the Stuck-Open fault (SOP). The object of this paper is to develop a procedure to detect single SOPs in combinational circuits. It is shown, that in general, tests generated for stuck-at faults when applied in a particular sequence will detect all single SOP faults. In case of single redundancy in the network, the SOP fault on the redundant line cannot be detected. When there is reconvergent fan-out in the network, there is a one-one correspondence between the conditions for stuck-at fault and stuck-open fault detectability.

  7. Addressable-Matrix Integrated-Circuit Test Structure

    NASA Technical Reports Server (NTRS)

    Sayah, Hoshyar R.; Buehler, Martin G.

    1991-01-01

    Method of quality control based on use of row- and column-addressable test structure speeds collection of data on widths of resistor lines and coverage of steps in integrated circuits. By use of straightforward mathematical model, line widths and step coverages deduced from measurements of electrical resistances in each of various combinations of lines, steps, and bridges addressable in test structure. Intended for use in evaluating processes and equipment used in manufacture of application-specific integrated circuits.

  8. Multiplexing Superconducting Qubit Circuit for Single Microwave Photon Generation

    NASA Astrophysics Data System (ADS)

    George, R. E.; Senior, J.; Saira, O.-P.; Pekola, J. P.; de Graaf, S. E.; Lindström, T.; Pashkin, Yu A.

    2017-07-01

    We report on a device that integrates eight superconducting transmon qubits in λ /4 superconducting coplanar waveguide resonators fed from a common feedline. Using this multiplexing architecture, each resonator and qubit can be addressed individually, thus reducing the required hardware resources and allowing their individual characterisation by spectroscopic methods. The measured device parameters agree with the designed values, and the resonators and qubits exhibit excellent coherence properties and strong coupling, with the qubit relaxation rate dominated by the Purcell effect when brought in resonance with the resonator. Our analysis shows that the circuit is suitable for generation of single microwave photons on demand with an efficiency exceeding 80%.

  9. Photonic-integrated circuit for continuous-wave THz generation.

    PubMed

    Theurer, Michael; Göbel, Thorsten; Stanze, Dennis; Troppenz, Ute; Soares, Francisco; Grote, Norbert; Schell, Martin

    2013-10-01

    We demonstrate a photonic-integrated circuit for continuous-wave (cw) terahertz (THz) generation. By comprising two lasers and an optical phase modulator on a single chip, the full control of the THz signal is enabled via a unique bidirectional operation technique. Integrated heaters allow for continuous tuning of the THz frequency over 570 GHz. Applied to a coherent cw THz photomixing system operated at 1.5 μm optical wavelength, we reach a signal-to-noise ratio of 44 dB at 1.25 THz, which is identical to the performance of a standard system based on discrete components.

  10. Analog cosmological particle generation in a superconducting circuit

    NASA Astrophysics Data System (ADS)

    Tian, Zehua; Jing, Jiliang; Dragan, Andrzej

    2017-06-01

    We propose the use of a waveguidelike transmission line based on direct-current superconducting quantum interference devices (dc-SQUID) and demonstrate that the node flux in this transmission line behaves in the same way as quantum fields in an expanding (or contracting) universe. We show how to detect the analog cosmological particle generation and analyze its feasibility with current circuit quantum electrodynamics (cQED) technology. Our setup in principle paves a new way for the exploration of analog quantum gravitational effects.

  11. Multiplexing Superconducting Qubit Circuit for Single Microwave Photon Generation

    NASA Astrophysics Data System (ADS)

    George, R. E.; Senior, J.; Saira, O.-P.; Pekola, J. P.; de Graaf, S. E.; Lindström, T.; Pashkin, Yu A.

    2017-10-01

    We report on a device that integrates eight superconducting transmon qubits in λ /4 superconducting coplanar waveguide resonators fed from a common feedline. Using this multiplexing architecture, each resonator and qubit can be addressed individually, thus reducing the required hardware resources and allowing their individual characterisation by spectroscopic methods. The measured device parameters agree with the designed values, and the resonators and qubits exhibit excellent coherence properties and strong coupling, with the qubit relaxation rate dominated by the Purcell effect when brought in resonance with the resonator. Our analysis shows that the circuit is suitable for generation of single microwave photons on demand with an efficiency exceeding 80%.

  12. Elements configuration of the open lead test circuit

    SciTech Connect

    Fukuzaki, Yumi; Ono, Akira

    2016-07-06

    In the field of electronics, small electronic devices are widely utilized because they are easy to carry. The devices have various functions by user’s request. Therefore, the lead’s pitch or the ball’s pitch have been narrowed and high-density printed circuit board has been used in the devices. Use of the ICs which have narrow lead pitch makes normal connection difficult. When logic circuits in the devices are fabricated with the state-of-the-art technology, some faults have occurred more frequently. It can be divided into types of open faults and short faults. We have proposed a new test method using a test circuit in the past. This paper propose elements configuration of the test circuit.

  13. Test of circuit breakers under harmonic loading conditions. Final report

    SciTech Connect

    Estrada, T.; Briggs, S.J.; Khosla, N.

    1995-11-01

    Harmonic currents in Army installation power systems can cause voltage distortion, overheating of system components, and load disruption. The U.S. Army Center for Public Works also has periodically received reports of unexplained nuisance circuit breaker tripping, which in theory might be caused by harmonics. No industry standard literature is available on the behavior of circuit breakers under harmonic loading conditions, however. The objective of this work was to test the effects of harmonic loading conditions on three common types of low voltage, molded case circuit breakers used indoors on Army installations: thermal magnetic, magnetic only, and solid state. This experiment detected no nuisance tripping with any of the breakers tested. Additionally it was found that varying harmonic loading conditions did not affect manufacturer specified trip times for thermal magnetic or solid state circuit breakers. However, under moderate overload conditions, the same experimental harmonic conditions caused hazardous overheating and trip failure in the magnetic only circuit breakers. Based on a review of related nonexperimental industry literature on circuit breaker design and performance, the authors postulate that inherent design characteristics leave thermal magnetic and solid state circuit breakers unaffected by harmonics. The literature also suggests that the construction of the instantaneous tripping element in the magnetic only breakers may account for their overheating and trip failure in the experiment.

  14. On Parameterization of the Global Electric Circuit Generators

    NASA Astrophysics Data System (ADS)

    Slyunyaev, N. N.; Zhidkov, A. A.

    2016-08-01

    We consider the problem of generator parameterization in the global electric circuit (GEC) models. The relationship between the charge density and external current density distributions inside a thundercloud is studied using a one-dimensional description and a three-dimensional GEC model. It is shown that drastic conductivity variations in the vicinity of the cloud boundaries have a significant impact on the structure of the charge distribution inside the cloud. Certain restrictions on the charge density distribution in a realistic thunderstorm are found. The possibility to allow for conductivity inhomogeneities in the thunderstorm regions by introducing an effective external current density is demonstrated. Replacement of realistic thunderstorms with equivalent current dipoles in the GEC models is substantiated, an equation for the equivalent current is obtained, and the applicability range of this equation is analyzed. Relationships between the main GEC characteristics under variable parameterization of GEC generators are discussed.

  15. RF Testing Of Microwave Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Romanofsky, R. R.; Ponchak, G. E.; Shalkhauser, K. A.; Bhasin, K. B.

    1988-01-01

    Fixtures and techniques are undergoing development. Four test fixtures and two advanced techniques developed in continuing efforts to improve RF characterization of MMIC's. Finline/waveguide test fixture developed to test submodules of 30-GHz monolithic receiver. Universal commercially-manufactured coaxial test fixture modified to enable characterization of various microwave solid-state devices in frequency range of 26.5 to 40 GHz. Probe/waveguide fixture is compact, simple, and designed for non destructive testing of large number of MMIC's. Nondestructive-testing fixture includes cosine-tapered ridge, to match impedance wavequide to microstrip. Advanced technique is microwave-wafer probing. Second advanced technique is electro-optical sampling.

  16. Real-time fast physical random number generator with a photonic integrated circuit.

    PubMed

    Ugajin, Kazusa; Terashima, Yuta; Iwakawa, Kento; Uchida, Atsushi; Harayama, Takahisa; Yoshimura, Kazuyuki; Inubushi, Masanobu

    2017-03-20

    Random number generators are essential for applications in information security and numerical simulations. Most optical-chaos-based random number generators produce random bit sequences by offline post-processing with large optical components. We demonstrate a real-time hardware implementation of a fast physical random number generator with a photonic integrated circuit and a field programmable gate array (FPGA) electronic board. We generate 1-Tbit random bit sequences and evaluate their statistical randomness using NIST Special Publication 800-22 and TestU01. All of the BigCrush tests in TestU01 are passed using 410-Gbit random bit sequences. A maximum real-time generation rate of 21.1 Gb/s is achieved for random bit sequences in binary format stored in a computer, which can be directly used for applications involving secret keys in cryptography and random seeds in large-scale numerical simulations.

  17. Field tests of a circuit breaker synchronous control

    SciTech Connect

    Rajotte, R.J.; Charpentier, C.; Breault, S.; Le, H.H.; Huynh, H.; Desmarais, J.

    1995-07-01

    A circuit breaker synchronous control interface which controls the point-on-wave at which shunt reactor circuit breakers open or close has been developed and tested on Hydro-Quebec`s 735-kV power system. It takes into account the influence of outdoor temperature on the breaker closing and opening times. It is also equipped with a reignition and a high-inrush-current detection system. Opening tests at different preset arcing times were conducted and the arcing time range where there are no re-ignitions in air-blast breakers was established. The tests showed that the interface is a valuable device for the elimination of re-ignitions associated with the interruption of small inductive currents. Closing tests have shown that the interface is also useful for the limitation of high inrush currents by selecting an appropriate point-on-wave for circuit breaker closing.

  18. Extended life testing evaluation of complementary MOS integrated circuits

    NASA Technical Reports Server (NTRS)

    Brosnan, T. E.

    1972-01-01

    The purpose of the extended life testing evaluation of complementary MOS integrated circuits was twofold: (1) To ascertain the long life capability of complementary MOS devices. (2) To assess the objectivity and reliability of various accelerated life test methods as an indication or prediction tool. In addition, the determination of a suitable life test sequence for these devices was of importance. Conclusions reached based on the parts tested and the test results obtained was that the devices were not acceptable.

  19. Remote control circuit breaker evaluation testing. [for space shuttles

    NASA Technical Reports Server (NTRS)

    Bemko, L. M.

    1974-01-01

    Engineering evaluation tests were performed on several models/types of remote control circuit breakers marketed in an attempt to gain some insight into their potential suitability for use on the space shuttle vehicle. Tests included the measurement of several electrical and operational performance parameters under laboratory ambient, space simulation, acceleration and vibration environmental conditions.

  20. Testing Methods for Integrated Circuit Chips.

    DTIC Science & Technology

    1986-03-27

    34SignatUre Testing with Guaranteed Bounds for Fault Coverage," 192 L Test Cofrne pp. 75-82, November 1982. 33. Daniel , M. E. and Gwyn, C. W. , "CAD Sstems...for IC Design," IEEE Trans. on Corn te-Aide Deino Intarte__1-rc-T~sand -9ste m, V. CADi n. 11 PP. 2-1, Jnuary 1982. .34. Scacchi , W. , Gasser, L

  1. MIRAGE read-in integrated circuit testing results

    NASA Astrophysics Data System (ADS)

    Hoelter, Theodore R.; Henry, Blake A.; Graff, John H.; Aziz, Naseem Y.

    1999-07-01

    This paper describes the test results for the MIRAGE read- in-integrated-circuit (RIIC) designed by Indigo Systems Corporation. This RIIC, when mated with suspended membrane, micro-machined resistive elements, forms a highly advanced emitter array. This emitter array is used by Indigo and Santa Barbara Infrared Incorporated in a jointly developed product for infrared scene generation, called MIRAGE. The MIRAGE RIIC is a 512 X 512 pixel design which incorporates a number of features that extend the state of the art for emitter array RIIC devices. These innovations include an all-digital interface for scene data, snapshot image updates (all pixels show the new frame simultaneously), frame rates up to 200 Hz, operating modes that control the device output, power consumption, and diagnostic configuration. Tests measuring operating speed, RIIC functionality and D/A converter performance were completed. At 2.1 X 2.3 cm, this die is also the largest nonstitched device ever made by Indigo's foundry, American Microsystems Incorporated. As with any IC design, die yield is a critical factor that typically scales with the size and complexity. Die yield, and a statistical breakdown of the failures observed will be discussed.

  2. Automated Test Case Generator.

    DTIC Science & Technology

    1980-02-01

    which will fulfill the requirement. Included is a sample soft- are program which Is manually carried through the various steps of the DD I ’ R , 1473...path- condition of that test case. 1-6 , / 4 -- 1 Si E T11 -I r I I 1I T2 A S4 I2 S5 L -II r C T5 Level i blocks: I I S1, S2, S3, S4, S5, S6, S7 S8...asT followed by the test number. The two possible resolutions of that test, true and false, will be refered to as ’ R ’ and ’P’ followed by the 2-3

  3. Test circuits for verification of power device models

    SciTech Connect

    Pendharkar, S.; Winterhalter, C.; Trivedi, M.; Li, H.; Kurnia, A.; Divan, D.; Shenai, K.

    1995-12-31

    One of the most important components of any modern power converter topology is the power semiconductor device. To predict the behavior of high-power devices in complex circuits it is necessary to accurately characterize them. Because of the cost involved in building complex circuits, it is often necessary to carry out extensive simulations to understand the device behavior under various operating conditions imposed by the particular circuit topology. For accurate simulations, it is necessary to develop good and accurate device models using advanced device simulation tools. The device models are generally developed using static and some switching measurement data. To verify the accuracy of these models, the simulation data must be compared with the measured data under different operating conditions. Test circuits used to carry out such simulations and measurements must satisfy a number of criteria such as robustness, accuracy, cost efficiency and repeatability. In addition, they should be easy to simulate accurately. This paper presents some simple and accurate test circuits used for the verification of various power device models.

  4. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; procedures. Circuit breakers protecting low- and medium-voltage alternating... such tests, actuating any of the circuit breaker auxiliaries or control circuits in any manner which...

  5. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; procedures. Circuit breakers protecting low- and medium-voltage alternating... such tests, actuating any of the circuit breaker auxiliaries or control circuits in any manner which...

  6. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; procedures. 75.900-3 Section 75.900-3 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; procedures. Circuit breakers protecting low- and medium-voltage alternating... such tests, actuating any of the circuit breaker auxiliaries or control circuits in any manner which...

  7. Circuit For Current-vs.-Voltage Tests Of Semiconductors

    NASA Technical Reports Server (NTRS)

    Huston, Steven W.

    1991-01-01

    Circuit designed for measurement of dc current-versus-voltage characteristics of semiconductor devices. Operates in conjunction with x-y pen plotter or digital storage oscilloscope, which records data. Includes large feedback resistors to prevent high currents damaging device under test. Principal virtues: low cost, simplicity, and compactness. Also used to evaluate diodes and transistors.

  8. A Testing System for Diagnosing Misconceptions in DC Electric Circuits.

    ERIC Educational Resources Information Center

    Chang, Kuo-En; Liu, Sei-Hua; Chen, Sei-Wang

    1998-01-01

    Outlines a test-based diagnosis system for misconceptions in DC electric circuits and its three parts: problem library, problem selector and diagnoser. Discusses misconception discrimination and diagnosis theories, and reports the system supports satisfactory diagnosis. Includes an analysis of nine student misconceptions about electrical circuits…

  9. Back to the Future: Circuit-testing TS & OCD.

    PubMed

    Burton, Frank H

    2017-07-26

    A decade before the rise of optogenetics, the first behavioral "circuit-test" - transgenically modulating the output of a genetically-specified brain circuit element to examine its effect on behavior - was performed. The behaviors emulated in those mice were comorbid tics and compulsions, elicited by a gene borrowed from cholera bacteria and tailored to intracellularly neuropotentiate glutamatergic somatosensory cortical and limbic output neurons of cortico/amygdalo-striato-thalamo-cortical (CSTC) loop circuits. Two decades later, cutting-edge chemogenetic and optogenetic methods are again being devoted to further characterize the circuits thought to trigger, mediate, aggravate, or ameliorate TS & OCD symptoms. These tour de force studies support essential roles in tics and compulsions for topographically-parallel corticostriatal and amygdalar glutamatergic output neurons; their target dorsal striatal & ventral striatal (nucleus accumbens) medium spiny neurons (MSNs) of the direct striatothalamic (urge & motor activating) vs. indirect striatopallidal (urge & motor suppressing) output pathways; and their converging modulatory dopaminergic and histaminergic afferents. Going "back to the future" to circuit-map tics and compulsions will give us precision targets for future psychological, drug, medtech, and gene therapies; look for "dopamine bypasses" on your next trip in the DeLorean. Copyright © 2017 The Author. Published by Elsevier B.V. All rights reserved.

  10. Radiation Testing and Evaluation Issues for Modern Integrated Circuits

    NASA Technical Reports Server (NTRS)

    LaBel, Kenneth A.; Cohn, Lew M.

    2005-01-01

    Abstract. Changes in modern integrated circuit (IC) technologies have modified the way we approach and conduct radiation tolerance and testing of electronics. These changes include scaling of geometries, new materials, new packaging technologies, and overall speed and device complexity challenges. In this short course section, we will identify and discuss these issues as they impact radiation testing, modeling, and effects mitigation of modern integrated circuits. The focus will be on CMOS-based technologies, however, other high performance technologies will be discussed where appropriate. The effects of concern will be: Single-Event Effects (SEE) and steady state total ionizing dose (TID) IC response. However, due to the growing use of opto-electronics in space systems issues concerning displacement damage testing will also be considered. This short course section is not intended to provide detailed "how-to-test" information, but simply provide a snapshot of current challenges and some of the approaches being considered.

  11. Combinatorial Generation of Test Suites

    NASA Technical Reports Server (NTRS)

    Dvorak, Daniel L.; Barrett, Anthony C.

    2009-01-01

    Testgen is a computer program that generates suites of input and configuration vectors for testing other software or software/hardware systems. As systems become ever more complex, often, there is not enough time to test systems against all possible combinations of inputs and configurations, so test engineers need to be selective in formulating test plans. Testgen helps to satisfy this need: In response to a test-suite-requirement-specification model, it generates a minimal set of test vectors that satisfies all the requirements.

  12. Laser system for testing radiation imaging detector circuits

    NASA Astrophysics Data System (ADS)

    Zubrzycka, Weronika; Kasinski, Krzysztof

    2015-09-01

    Performance and functionality of radiation imaging detector circuits in charge and position measurement systems need to meet tight requirements. It is therefore necessary to thoroughly test sensors as well as read-out electronics. The major disadvantages of using radioactive sources or particle beams for testing are high financial expenses and limited accessibility. As an alternative short pulses of well-focused laser beam are often used for preliminary tests. There are number of laser-based devices available on the market, but very often their applicability in this field is limited. This paper describes concept, design and validation of laser system for testing silicon sensor based radiation imaging detector circuits. The emphasis is put on keeping overall costs low while achieving all required goals: mobility, flexible parameters, remote control and possibility of carrying out automated tests. The main part of the developed device is an optical pick-up unit (OPU) used in optical disc drives. The hardware includes FPGA-controlled circuits for laser positioning in 2 dimensions (horizontal and vertical), precision timing (frequency and number) and amplitude (diode current) of short ns-scale (3.2 ns) light pulses. The system is controlled via USB interface by a dedicated LabVIEW-based application enabling full manual or semi-automated test procedures.

  13. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... § 77.900-1 Testing, examination, and maintenance of circuit breakers; procedures. Circuit breakers... qualified as provided in § 77.103. In performing such tests, the circuit breaker auxiliaries or control...

  14. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; procedures. 77.900-1 Section 77.900-1 Mineral Resources MINE SAFETY AND HEALTH... § 77.900-1 Testing, examination, and maintenance of circuit breakers; procedures. Circuit breakers... qualified as provided in § 77.103. In performing such tests, the circuit breaker auxiliaries or control...

  15. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least once... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  16. A Digital Coreless Maximum Power Point Tracking Circuit for Thermoelectric Generators

    NASA Astrophysics Data System (ADS)

    Kim, Shiho; Cho, Sungkyu; Kim, Namjae; Baatar, Nyambayar; Kwon, Jangwoo

    2011-05-01

    This paper describes a maximum power point tracking (MPPT) circuit for thermoelectric generators (TEG) without a digital controller unit. The proposed method uses an analog tracking circuit that samples the half point of the open-circuit voltage without a digital signal processor (DSP) or microcontroller unit for calculating the peak power point using iterative methods. The simulation results revealed that the MPPT circuit, which employs a boost-cascaded-with-buck converter, handled rapid variation of temperature and abrupt changes of load current; this method enables stable operation with high power transfer efficiency. The proposed MPPT technique is a useful analog MPPT solution for thermoelectric generators.

  17. E-learning platform for automated testing of electronic circuits using signature analysis method

    NASA Astrophysics Data System (ADS)

    Gherghina, Cǎtǎlina; Bacivarov, Angelica; Bacivarov, Ioan C.; Petricǎ, Gabriel

    2016-12-01

    Dependability of electronic circuits can be ensured only through testing of circuit modules. This is done by generating test vectors and their application to the circuit. Testability should be viewed as a concerted effort to ensure maximum efficiency throughout the product life cycle, from conception and design stage, through production to repairs during products operating. In this paper, is presented the platform developed by authors for training for testability in electronics, in general and in using signature analysis method, in particular. The platform allows highlighting the two approaches in the field namely analog and digital signature of circuits. As a part of this e-learning platform, it has been developed a database for signatures of different electronic components meant to put into the spotlight different techniques implying fault detection, and from this there were also self-repairing techniques of the systems with this kind of components. An approach for realizing self-testing circuits based on MATLAB environment and using signature analysis method is proposed. This paper analyses the benefits of signature analysis method and simulates signature analyzer performance based on the use of pseudo-random sequences, too.

  18. Statistical tests for closure of plate motion circuits

    NASA Technical Reports Server (NTRS)

    Gordon, Richard G.; Stein, Seth; Demets, Charles; Argus, Donald F.

    1987-01-01

    Two methods, one based on a chi-square test and the second on an F-ratio test, of testing for the plate motion circuit closures are described and evaluated. The chi-square test is used to evaluate goodness of fit, and it is assumed that the assigned errors are accurate estimates of the true errors in the data. The F-ratio test is used to compare variances of distributions, and it is assumed that the relative values of assigned error are accurate. The two methods are applied to the data of Minster and Jordan (1978) on the motion of the three plates that meet at the Galapagos Triple Junction, and the motion of the three plates that meet at the Indian Ocean Triple Junction. It is noted that the F-ratio plate circuit closure test is more useful than the chi-square test for identifying systematic misfits in data because the chi-square test overestimates the errors of plate motion data.

  19. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and maintenance of circuit breakers; procedures. Circuit breakers protecting low- and medium-voltage alternating current circuits serving three-phase alternating current equipment and their auxiliary devices shall...

  20. 30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and maintenance of circuit breakers; procedures. Circuit breakers protecting low- and medium-voltage alternating current circuits serving three-phase alternating current equipment and their auxiliary devices shall...

  1. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  2. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  3. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and...

  4. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits. Such...

  5. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  6. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  7. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and...

  8. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and...

  9. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits. Such...

  10. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  11. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  12. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  13. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits. Such...

  14. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits. Such...

  15. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; procedures. 77.800-1 Section 77.800-1 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  16. 30 CFR 77.800-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... circuit breakers; record. 77.800-2 Section 77.800-2 Mineral Resources MINE SAFETY AND HEALTH..., examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting high-voltage circuits. Such...

  17. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and...

  18. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits... shall include visual observation of all components of the circuit breaker and its auxiliary devices, and...

  19. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... circuit breakers; record. 75.800-4 Section 75.800-4 Mineral Resources MINE SAFETY AND HEALTH... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  20. Universal nondestructive mm-wave integrated circuit test fixture

    NASA Technical Reports Server (NTRS)

    Romanofsky, Robert R. (Inventor); Shalkhauser, Kurt A. (Inventor)

    1990-01-01

    Monolithic microwave integrated circuit (MMIC) test includes a bias module having spring-loaded contacts which electrically engage pads on a chip carrier disposed in a recess of a base member. RF energy is applied to and passed from the chip carrier by chamfered edges of ridges in the waveguide passages of housings which are removably attached to the base member. Thru, Delay, and Short calibration standards having dimensions identical to those of the chip carrier assure accuracy and reliability of the test. The MMIC chip fits in an opening in the chip carrier with the boundaries of the MMIC lying on movable reference planes thereby establishing accuracy and flexibility.

  1. Ion implantation in silicon to facilitate testing of photonic circuits

    NASA Astrophysics Data System (ADS)

    Reed, Graham T.; Milosevic, Milan M.; Chen, Xia; Cao, Wei; Littlejohns, Callum G.; Wang, Hong; Khokhar, Ali Z.; Thomson, David J.

    2017-02-01

    In recent years, we have presented results on the development of erasable gratings in silicon to facilitate wafer scale testing of photonics circuits via ion implantation of germanium. Similar technology can be employed to develop a range of optical devices that are reported in this paper. Ion implantation into silicon causes radiation damage resulting in a refractive index increase, and can therefore form the basis of multiple optical devices. We demonstrate the principle of a series of devices for wafers scale testing and have also implemented the ion implantation based refractive index change in integrated photonics devices for device trimming.

  2. F-1 Gas Generator test

    NASA Image and Video Library

    2015-09-03

    THE GAS GENERATOR TO AN F-1 ENGINE, THE MOST POWERFUL ROCKET ENGINE EVER BUILT, IS TEST-FIRED AT NASA'S MARSHALL SPACE FLIGHT CENTER IN HUNTSVILLE, ALABAMA, ON SEPT. 3. ALTHOUGH THE ENGINE WAS ORIGINALLY BUILT TO POWER THE SATURN V ROCKETS DURING AMERICA'S MISSIONS TO THE MOON, THIS TEST ARTICLE HAD NEW PARTS CREATED USING ADDITIVE MANUFACTURING, OR 3-D PRINTING, TO TEST THE VIABILITY OF THE TECHNOLOGY FOR BUILDING NEW ENGINE DESIGNS.

  3. Capabilities and Testing of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK), which was used in the SNAP-10A fission reactor, was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around a 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. NaK flow rates of greater than 1 kg/sec may be achieved, depending upon the power applied to the EM pump. The heat exchanger provides for the removal of thermal energy from the circuit, simulating the presence of an energy conversion system. The presence of the test section increases the versatility of the circuit. A second liquid metal pump, an energy conversion system, and highly instrumented thermal simulators are all being considered for inclusion within the test section. This paper summarizes the capabilities and ongoing testing of the Fission Surface Power Primary Test Circuit (FSP-PTC).

  4. Series and parallel arc-fault circuit interrupter tests.

    SciTech Connect

    Johnson, Jay Dean; Fresquez, Armando J.; Gudgel, Bob; Meares, Andrew

    2013-07-01

    While the 2011 National Electrical Codeª (NEC) only requires series arc-fault protection, some arc-fault circuit interrupter (AFCI) manufacturers are designing products to detect and mitigate both series and parallel arc-faults. Sandia National Laboratories (SNL) has extensively investigated the electrical differences of series and parallel arc-faults and has offered possible classification and mitigation solutions. As part of this effort, Sandia National Laboratories has collaborated with MidNite Solar to create and test a 24-string combiner box with an AFCI which detects, differentiates, and de-energizes series and parallel arc-faults. In the case of the MidNite AFCI prototype, series arc-faults are mitigated by opening the PV strings, whereas parallel arc-faults are mitigated by shorting the array. A range of different experimental series and parallel arc-fault tests with the MidNite combiner box were performed at the Distributed Energy Technologies Laboratory (DETL) at SNL in Albuquerque, NM. In all the tests, the prototype de-energized the arc-faults in the time period required by the arc-fault circuit interrupt testing standard, UL 1699B. The experimental tests confirm series and parallel arc-faults can be successfully mitigated with a combiner box-integrated solution.

  5. Apparatus and method for defect testing of integrated circuits

    SciTech Connect

    Cole, E.I. Jr.; Soden, J.M.

    2000-02-29

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V(DD), to an IC under test and measures a transient voltage component, V(DDT), signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V(DDT) signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V(DDT) signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  6. Apparatus and method for defect testing of integrated circuits

    DOEpatents

    Cole, Jr., Edward I.; Soden, Jerry M.

    2000-01-01

    An apparatus and method for defect and failure-mechanism testing of integrated circuits (ICs) is disclosed. The apparatus provides an operating voltage, V.sub.DD, to an IC under test and measures a transient voltage component, V.sub.DDT, signal that is produced in response to switching transients that occur as test vectors are provided as inputs to the IC. The amplitude or time delay of the V.sub.DDT signal can be used to distinguish between defective and defect-free (i.e. known good) ICs. The V.sub.DDT signal is measured with a transient digitizer, a digital oscilloscope, or with an IC tester that is also used to input the test vectors to the IC. The present invention has applications for IC process development, for the testing of ICs during manufacture, and for qualifying ICs for reliability.

  7. Test Generator for MATLAB Simulations

    NASA Technical Reports Server (NTRS)

    Henry, Joel

    2011-01-01

    MATLAB Automated Test Tool, version 3.0 (MATT 3.0) is a software package that provides automated tools that reduce the time needed for extensive testing of simulation models that have been constructed in the MATLAB programming language by use of the Simulink and Real-Time Workshop programs. MATT 3.0 runs on top of the MATLAB engine application-program interface to communicate with the Simulink engine. MATT 3.0 automatically generates source code from the models, generates custom input data for testing both the models and the source code, and generates graphs and other presentations that facilitate comparison of the outputs of the models and the source code for the same input data. Context-sensitive and fully searchable help is provided in HyperText Markup Language (HTML) format.

  8. 46 CFR 111.12-5 - Construction and testing of generators.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 46 Shipping 4 2013-10-01 2013-10-01 false Construction and testing of generators. 111.12-5 Section... ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and testing of generators. Each generator must meet the applicable requirements for construction and testing...

  9. 46 CFR 111.12-5 - Construction and testing of generators.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 46 Shipping 4 2010-10-01 2010-10-01 false Construction and testing of generators. 111.12-5 Section... ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and testing of generators. Each generator must meet the applicable requirements for construction and testing...

  10. 46 CFR 111.12-5 - Construction and testing of generators.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 46 Shipping 4 2011-10-01 2011-10-01 false Construction and testing of generators. 111.12-5 Section... ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and testing of generators. Each generator must meet the applicable requirements for construction and testing...

  11. 46 CFR 111.12-5 - Construction and testing of generators.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 46 Shipping 4 2014-10-01 2014-10-01 false Construction and testing of generators. 111.12-5 Section... ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and testing of generators. Each generator must meet the applicable requirements for construction and testing...

  12. 46 CFR 111.12-5 - Construction and testing of generators.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 46 Shipping 4 2012-10-01 2012-10-01 false Construction and testing of generators. 111.12-5 Section... ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and testing of generators. Each generator must meet the applicable requirements for construction and testing...

  13. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  14. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200...

  15. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 49 Transportation 4 2013-10-01 2013-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least once...

  16. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least once...

  17. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least once...

  18. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least once...

  19. 49 CFR 236.577 - Test, acknowledgement, and cut-in circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Test, acknowledgement, and cut-in circuits. 236.577 Section 236.577 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL..., acknowledgement, and cut-in circuits. Test, acknowledgement, and cut-in circuits shall be tested at least...

  20. Generation of electromagnetic energy in a magnetic cumulation generator with the use of inductively coupled circuits with a variable coupling coefficient

    NASA Astrophysics Data System (ADS)

    Gilev, S. D.; Prokopiev, V. S.

    2017-07-01

    A method of generation of electromagnetic energy and magnetic flux in a magnetic cumulation generator is proposed. The method is based on dynamic variation of the circuit coupling coefficient. This circuit is compared with other available circuits of magnetic energy generation with the help of magnetic cumulation (classical magnetic cumulation generator, generator with transformer coupling, and generator with a dynamic transformer). It is demonstrated that the proposed method allows obtaining high values of magnetic energy. The proposed circuit is found to be more effective than the known transformer circuit. Experiments on electromagnetic energy generation are performed, which demonstrate the efficiency of the proposed method.

  1. Voltage injection and readout method for PCB (printed circuit board) testing

    NASA Astrophysics Data System (ADS)

    Zentai, G.

    2006-03-01

    The main objectives of PCB (Printed Circuit Board) testing are to find short and open circuits before attaching components to the PCB. An electrostatic imaging technique was described earlier by Zentai at al. in the SPIE-NDE 2003 conference and has been accepted as a US patent. The main goal of that application was to test the PCBs quickly and efficiently without attaching test probes to each of the traces. It was achieved with the proposed technique. However, we still had to use test probe matrix for generating test signals in the traces and the detected signal was greatly reduced in reference to the test signal because of capacitive sharing of charges caused by the insulator layer placed between the PCB and the TFT sensor array. A new idea has been developed for applying voltages to the traces with an addressing matrix, different from the pin addressing one. This matrix is similar to the readout matrix that the previous method referenced to, but instead of readout circuits, driver circuits are connected to the pixels to apply voltages to them. The printed circuit board is laid on top of the array, but rather than using an insulator foil, a directional conducting foam (rubber) layer can be applied between the excitation matrix (array) and the PCB. We get direct coupling of the matrix pixels to the PCB traces and no connection between neighboring pixels (traces) using the directional conductive layer, which conducts only in z direction and not in x (and y) direction. Therefore, by addressing each pixel separately, which is easy to do by software, we get an addressable voltage (pulse) injector matrix. The same directional conducting foam coupling can also be used for reading out the image of traces. Because the capacitive coupling is eliminated, the detected signal increases and so the sensitivity.

  2. Integrated circuit generating 3- and 5-scroll attractors

    NASA Astrophysics Data System (ADS)

    Trejo-Guerra, R.; Tlelo-Cuautle, E.; Jiménez-Fuentes, J. M.; Sánchez-López, C.; Muñoz-Pacheco, J. M.; Espinosa-Flores-Verdad, G.; Rocha-Pérez, J. M.

    2012-11-01

    This paper introduces the experimental realization of the first integrated circuit of a multi-scroll continuous chaotic oscillator showing 3- and 5-scroll attractors. It is based on a variant of the Chua's system. The most relevant issue is the implementation of a saw-tooth-like nonlinear function, which is designed by using floating gate MOS (FGMOS) transistors. Therefore, the realization of a voltage-to-current nonlinear cell by a piecewise-linear approach allows us to have only two external control inputs instead of numerous external voltage references, as usually done in current circuit realizations. Experimental results of the proposed integrated multi-scroll oscillator along with its corner analysis are provided.

  3. 37. SAR2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    37. SAR-2, SHOWING OIL CIRCUIT BREAKERS (ABOVE) AND GENERATOR FIELD COIL CONTROL RHEOSTATS (BELOW). SCE negative no. 10331, November 1, 1923. Photograph by G. Haven Bishop. - Santa Ana River Hydroelectric System, SAR-2 Powerhouse, Redlands, San Bernardino County, CA

  4. Conjugate feedback induced suppression and generation of oscillations in the Chua circuit: experiments and simulations.

    PubMed

    Mandal, Tirtha; Singla, Tanu; Rivera, M; Parmananda, P

    2013-03-01

    We study the suppression (amplitude death) and generation of oscillations (rhythmogenesis) in the Chua circuit using a feedback term consisting of conjugate variables (conjugate feedback). When the independent Chua circuit (without feedback) is placed in the oscillatory domain, this conjugate feedback induces amplitude death in the system. On the contrary, introducing the conjugate feedback in the system exhibiting fixed point behavior results in the generation of rhythms. Furthermore, it is observed that the dynamics of the Chua circuit could be tuned efficiently by varying the strength of this feedback term. Both experimental and numerical results are presented.

  5. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  6. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will...

  7. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  8. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  9. Surface and 60 FSW Performance Testing of the Modified MBS 2000 Closed Circuit Oxygen Rebreather

    DTIC Science & Technology

    2007-03-05

    SURFACE AND 60 FSW PERFORMANCE TESTING OF THE MODIFIED MBS 2000 CLOSED CIRCUIT OXYGEN REBREATHER by Dr. David...4 Executive Summary INTRODUCTION The Morgan Breathing System (MBS) 2000 is a closed - circuit oxygen rebreather designed to provide oxygen...2000 closed circuit oxygen rebreather (MBS 2000) that was modified from its previous configuration, as originally tested and reported in Fothergill

  10. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; record. 77.900-2 Section 77.900-2 Mineral Resources MINE SAFETY AND HEALTH... § 77.900-2 Testing, examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair or adjustment of all circuit breakers...

  11. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; record. 77.900-2 Section 77.900-2 Mineral Resources MINE SAFETY AND HEALTH... § 77.900-2 Testing, examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair or adjustment of all circuit breakers...

  12. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; record. 77.900-2 Section 77.900-2 Mineral Resources MINE SAFETY AND HEALTH... § 77.900-2 Testing, examination, and maintenance of circuit breakers; record. The operator shall maintain a written record of each test, examination, repair or adjustment of all circuit breakers...

  13. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  14. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  15. 42 CFR 84.96 - Service time test; closed-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to...

  16. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in...

  17. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in...

  18. Research of 100 MHz ultra-low-jitter clock generating circuit.

    PubMed

    Qiu, Duyu; Tan, Feng; Tian, Shulin; Zeng, Hao; Ye, Peng

    2015-04-01

    Jitter which quantifies the quality of a clock is an important specification. It is of great significance for an electronic system. To obtain a good signal-to-noise ratio for sampling systems, there must be clocks with low jitter performances. By using the relationship between jitter and phase noise, the 100 MHz clock generating circuit with ultra-low jitter and phase noise characteristics are studied in this paper. Bipolar junction transistor with low noise figure and low corner frequency should be selected. Inductance and capacitance in the feedback circuit are obviously the main contributions to the jitter. Impacts of the loaded quality factor (Q(L)) of the circuit on the jitter are analyzed, and the explicit expression for the jitter based on circuit components is derived as well. The simulation and experiment results are proved to show that the jitter and phase noise characteristics can be improved by increasing Q(L) of the circuit.

  19. Research of 100 MHz ultra-low-jitter clock generating circuit

    SciTech Connect

    Qiu, Duyu; Tan, Feng; Tian, Shulin; Zeng, Hao; Ye, Peng

    2015-04-15

    Jitter which quantifies the quality of a clock is an important specification. It is of great significance for an electronic system. To obtain a good signal-to-noise ratio for sampling systems, there must be clocks with low jitter performances. By using the relationship between jitter and phase noise, the 100 MHz clock generating circuit with ultra-low jitter and phase noise characteristics are studied in this paper. Bipolar junction transistor with low noise figure and low corner frequency should be selected. Inductance and capacitance in the feedback circuit are obviously the main contributions to the jitter. Impacts of the loaded quality factor (Q{sub L}) of the circuit on the jitter are analyzed, and the explicit expression for the jitter based on circuit components is derived as well. The simulation and experiment results are proved to show that the jitter and phase noise characteristics can be improved by increasing Q{sub L} of the circuit.

  20. A test technique for measuring lightning-induced voltages on aircraft electrical circuits

    NASA Technical Reports Server (NTRS)

    Walko, L. C.

    1974-01-01

    The development of a test technique used for the measurement of lightning-induced voltages in the electrical circuits of a complete aircraft is described. The resultant technique utilizes a portable device known as a transient analyzer capable of generating unidirectional current impulses similar to lightning current surges, but at a lower current level. A linear relationship between the magnitude of lightning current and the magnitude of induced voltage permitted the scaling up of measured induced values to full threat levels. The test technique was found to be practical when used on a complete aircraft.

  1. Design and testing of integrated circuits for reactor protection channels

    SciTech Connect

    Battle, R.E.; Vandermolen, R.I.; Jagadish, U.; Swail, B.K.; Naser, J.; Rana, I.

    1995-06-01

    Custom and semicustom application-specific integrated circuit design and testing methods are investigated for use in research and commercial nuclear reactor safety systems. The Electric Power Research Institute and Oak Ridge National Laboratory are working together through a cooperative research and development agreement to apply modern technology to a nuclear reactor protection system. Purpose of this project is to demonstrate to the nuclear industry an alternative approach for new or upgrade reactor protection and safety system signal processing and voting logic. Motivation for this project stems from (1) the difficulty of proving that software-based protection systems are adequately reliable, (2) the obsolescence of the original equipment, and (3) the improved performance of digital processing.

  2. Design and testing of integrated circuits for reactor protection channels

    SciTech Connect

    Battle, R.E.; Vandermolen, R.I.; Jagadish, U.; Swail, B.K.; Naser, J.

    1995-06-01

    Custom and semicustom application-specific integrated circuit design and testing methods are investigated for use in research and commercial nuclear reactor safety systems. The Electric Power Research Institute and Oak Ridge National Laboratory are working together through a cooperative research and development agreement to apply modern technology to a nuclear reactor protection system. The purpose of this project is to demonstrate to the nuclear industry an alternative approach for new or upgrade reactor protection and safety system signal processing and voting logic. Motivation for this project stems from (1) the difficulty of proving that software-based protection systems are adequately reliable, (2) the obsolescence of the original equipment, and (3) the improved performance of digital processing. A demonstration model for protection system of PWR reactor has been designed and built.

  3. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... circuit breakers; record. 75.900-4 Section 75.900-4 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; record. The operator of any coal mine shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting low- and medium-voltage...

  4. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... circuit breakers; record. 75.900-4 Section 75.900-4 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; record. The operator of any coal mine shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting low- and medium-voltage...

  5. 30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... circuit breakers; record. 75.900-4 Section 75.900-4 Mineral Resources MINE SAFETY AND HEALTH... maintenance of circuit breakers; record. The operator of any coal mine shall maintain a written record of each test, examination, repair, or adjustment of all circuit breakers protecting low- and medium-voltage...

  6. Modeling self-priming circuits for dielectric elastomer generators towards optimum voltage boost

    NASA Astrophysics Data System (ADS)

    Zanini, Plinio; Rossiter, Jonathan; Homer, Martin

    2016-04-01

    One of the main challenges for the practical implementation of dielectric elastomer generators (DEGs) is supplying high voltages. To address this issue, systems using self-priming circuits (SPCs) — which exploit the DEG voltage swing to increase its supplied voltage — have been used with success. A self-priming circuit consists of a charge pump implemented in parallel with the DEG circuit. At each energy harvesting cycle, the DEG receives a low voltage input and, through an almost constant charge cycle, generates a high voltage output. SPCs receive the high voltage output at the end of the energy harvesting cycle and supply it back as input for the following cycle, using the DEG as a voltage multiplier element. Although rules for designing self-priming circuits for dielectric elastomer generators exist, they have been obtained from intuitive observation of simulation results and lack a solid theoretical foundation. Here we report the development of a mathematical model to predict voltage boost using self-priming circuits. The voltage on the DEG attached to the SPC is described as a function of its initial conditions, circuit parameters/layout, and the DEG capacitance. Our mathematical model has been validated on an existing DEG implementation from the literature, and successfully predicts the voltage boost for each cycle. Furthermore, it allows us to understand the conditions for the boost to exist, and obtain the design rules that maximize the voltage boost.

  7. Design and implementation of therapeutic ultrasound generating circuit for dental tissue formation and tooth-root healing.

    PubMed

    Woon Tiong Ang; Scurtescu, C; Wing Hoy; El-Bialy, T; Ying Yin Tsui; Jie Chen

    2010-02-01

    Biological tissue healing has recently attracted a great deal of research interest in various medical fields. Trauma to teeth, deep and root caries, and orthodontic treatment can all lead to various degrees of root resorption. In our previous study, we showed that low-intensity pulsed ultrasound (LIPUS) enhances the growth of lower incisor apices and accelerates their rate of eruption in rabbits by inducing dental tissue growth. We also performed clinical studies and demonstrated that LIPUS facilitates the healing of orthodontically induced teeth-root resorption in humans. However, the available LIPUS devices are too large to be used comfortably inside the mouth. In this paper, the design and implementation of a low-power LIPUS generator is presented. The generator is the core of the final intraoral device for preventing tooth root loss and enhancing tooth root tissue healing. The generator consists of a power-supply subsystem, an ultrasonic transducer, an impedance-matching circuit, and an integrated circuit composed of a digital controller circuitry and the associated driver circuit. Most of our efforts focus on the design of the impedance-matching circuit and the integrated system-on-chip circuit. The chip was designed and fabricated using 0.8- ¿m high-voltage technology from Dalsa Semiconductor, Inc. The power supply subsystem and its impedance-matching network are implemented using discrete components. The LIPUS generator was tested and verified to function as designed and is capable of producing ultrasound power up to 100 mW in the vicinity of the transducer's resonance frequency at 1.5 MHz. The power efficiency of the circuitry, excluding the power supply subsystem, is estimated at 70%. The final products will be tailored to the exact size of teeth or biological tissue, which is needed to be used for stimulating dental tissue (dentine and cementum) healing.

  8. Detailed Pseudo-Static Drive Train Modelling with Generator Short Circuit

    NASA Astrophysics Data System (ADS)

    Warnock, Christopher; Infield, David

    2016-09-01

    Drivetrain failures contribute significantly to wind turbine downtime. Although the root causes of these failures are not yet fully understood, transient events are regarded as an important contributory factor. Despite extensive drive train modelling, limited work has been carried out to assess the impact of a generator short circuit on the drivetrain. In most cases, a generator short circuit is classed as a failure in itself with minimal focus on the subsequent effects on the gearbox and other drivetrain components. This paper will look to analyse the loading on the drivetrain for a doubly fed induction generator (DFIG) short circuit event with turbine ride through using a combination of Simulink, Garrad Hassan's Bladed and RomaxWind drive train modelling software.

  9. A new generation computerised metacognitive cognitive remediation programme for schizophrenia (CIRCuiTS): a randomised controlled trial.

    PubMed

    Reeder, C; Huddy, V; Cella, M; Taylor, R; Greenwood, K; Landau, S; Wykes, T

    2017-09-04

    Cognitive remediation (CR) is a psychological therapy, which improves cognitive and social functioning in people with schizophrenia. It is now being implemented within routine clinical services and mechanisms of change are being explored. We designed a new generation computerised CR programme, CIRCuiTS (Computerised Interactive Remediation of Cognition - a Training for Schizophrenia), to enhance strategic and metacognitive processing, with an integrated focus on the transfer of cognitive skills to daily living. This large trial tested its feasibility to be delivered in therapist-led and independent sessions, and its efficacy for improved cognitive and social functioning. A two arm single blind randomised superiority trial comparing CIRCuiTS plus treatment-as-usual (TAU) with TAU alone in 93 people with a diagnosis of schizophrenia. Cognitive, social functioning and symptom outcomes were assessed at pre- and post-therapy and 3 months later. 85% adhered to CIRCuiTS, completing a median of 28 sessions. There were significant improvements in visual memory at post-treatment (p = 0.009) and follow-up (p = 0.001), and a trend for improvements in executive function at post-treatment (p = 0.056) in favour of the CIRCuiTS group. Community function was also differentially and significantly improved in the CIRCuiTS group at post-treatment (p = 0.003) but not follow-up, and was specifically predicted by improved executive functions. CIRCuiTS was beneficial for improving memory and social functioning. Improved executive functioning emerges as a consistent predictor of functional gains and should be considered an important CR target to achieve functional change. A larger-scale effectiveness trial of CIRCuiTS is now indicated.

  10. Voltage escalation and reignition behavior of vacuum generator circuit breakers during load shedding

    SciTech Connect

    Glinkowski, M.T.; Gutierrez, M.R.; Braun, D.

    1997-01-01

    This paper focuses on multiple reignitions and voltage escalation that may occur during load shedding when vacuum circuit-breakers are used as generator circuit-breakers. The probability of multiple reignitions and voltage escalation is proportional to the arc angle and is very small. However, repeated reignitions and voltage escalation may be observed in vacuum switching devices after opening operations due to their ability to interrupt high frequency currents. The transformer side capacitance and the magnitude of the load shedding play a significant role in developing repeated reignitions and voltage escalation when vacuum circuit breakers are used as generator circuit breakers. Of particular concern is the case when a protective capacitor is connected to the system side of the circuit breaker. Although this capacitor reduces the magnitude of the Transient Recovery Voltage, it decreases the transient frequencies and increases the reignition current that flows through the vacuum circuit breaker after a voltage breakdown. In all the cases under study, the reignition/escalation problems are more severe with the protective capacitor connected to the system for relative low load shedding at short arc angles.

  11. Generation of Fock states in a superconducting quantum circuit.

    PubMed

    Hofheinz, Max; Weig, E M; Ansmann, M; Bialczak, Radoslaw C; Lucero, Erik; Neeley, M; O'Connell, A D; Wang, H; Martinis, John M; Cleland, A N

    2008-07-17

    Spin systems and harmonic oscillators comprise two archetypes in quantum mechanics. The spin-1/2 system, with two quantum energy levels, is essentially the most nonlinear system found in nature, whereas the harmonic oscillator represents the most linear, with an infinite number of evenly spaced quantum levels. A significant difference between these systems is that a two-level spin can be prepared in an arbitrary quantum state using classical excitations, whereas classical excitations applied to an oscillator generate a coherent state, nearly indistinguishable from a classical state. Quantum behaviour in an oscillator is most obvious in Fock states, which are states with specific numbers of energy quanta, but such states are hard to create. Here we demonstrate the controlled generation of multi-photon Fock states in a solid-state system. We use a superconducting phase qubit, which is a close approximation to a two-level spin system, coupled to a microwave resonator, which acts as a harmonic oscillator, to prepare and analyse pure Fock states with up to six photons. We contrast the Fock states with coherent states generated using classical pulses applied directly to the resonator.

  12. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, Lowell B.

    1998-01-01

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.

  13. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    DOEpatents

    Andrews, L.B.

    1998-08-18

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

  14. Apparatus for and method of testing an electrical ground fault circuit interrupt device

    SciTech Connect

    Andrews, L.B.

    1998-08-18

    An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

  15. Life testing of a low voltage air circuit breaker

    SciTech Connect

    Subudhi, M. ); Aggarwal, S. )

    1992-01-01

    A DS-416 low voltage air circuit breaker manufactured by Westinghouse was mechanically cycled to identify age-related degradation in the various breaker subcomponents, specifically the power-operated mechanism. This accelerated aging test was performed on one breaker unit for over 36,000 cycles. Three separate pole shafts, one with a 60-degree weld, one with a 120-degree weld, and one with a 180-degree weld in the third pole lever were used to characterize cracking in the welds. In addition, during the testing three different operating mechanisms and several other parts were replaced as they became inoperable. Among the seven welds on the pole shaft, {number sign}1 and {number sign}3 were found to be critical ones whose fracture can result in misalignment of the pole levers. This can lead to problems with the operating mechanism, including the burning of coils, excessive wear in certain parts, and overstressed linkages. Furthermore, the limiting service life of a number of subcomponents of the power-operated mechanism, including the operating mechanism itself, were assessed. Based on these findings, suggestions are provided to alleviate the age-related degradation that could occur as a result of normal closing and opening of the breaker contacts during its service life. Also, cause and effect analyses of various age-related degradation in various breaker parts are discussed.

  16. Life testing of a low voltage air circuit breaker

    SciTech Connect

    Subudhi, M.; Aggarwal, S.

    1992-06-01

    A DS-416 low voltage air circuit breaker manufactured by Westinghouse was mechanically cycled to identify age-related degradation in the various breaker subcomponents, specifically the power-operated mechanism. This accelerated aging test was performed on one breaker unit for over 36,000 cycles. Three separate pole shafts, one with a 60-degree weld, one with a 120-degree weld, and one with a 180-degree weld in the third pole lever were used to characterize cracking in the welds. In addition, during the testing three different operating mechanisms and several other parts were replaced as they became inoperable. Among the seven welds on the pole shaft, {number_sign}1 and {number_sign}3 were found to be critical ones whose fracture can result in misalignment of the pole levers. This can lead to problems with the operating mechanism, including the burning of coils, excessive wear in certain parts, and overstressed linkages. Furthermore, the limiting service life of a number of subcomponents of the power-operated mechanism, including the operating mechanism itself, were assessed. Based on these findings, suggestions are provided to alleviate the age-related degradation that could occur as a result of normal closing and opening of the breaker contacts during its service life. Also, cause and effect analyses of various age-related degradation in various breaker parts are discussed.

  17. Circuit Model for Parameter Study of Marx Generators on Megajoule Machines

    DTIC Science & Technology

    2001-06-01

    Sandia National Laboratories (SNL) is planning to redesign the pulsed power driver on Z, including the Marx generators, the intermediate-store water...capacitors, the laser triggered switches and the pulse-forming lines to increase the energy delivered to a Z-pinch load. The present Marx system...generator. A circuit model has been developed using MICROCAP to model one of the 36- Marx generators. The model contains the capacitors, inter-stage

  18. Design and test of component circuits of an integrated quantum voltage noise source for Johnson noise thermometry

    NASA Astrophysics Data System (ADS)

    Yamada, Takahiro; Maezawa, Masaaki; Urano, Chiharu

    2015-11-01

    We present design and testing of a pseudo-random number generator (PRNG) and a variable pulse number multiplier (VPNM) which are digital circuit subsystems in an integrated quantum voltage noise source for Jonson noise thermometry. Well-defined, calculable pseudo-random patterns of single flux quantum pulses are synthesized with the PRNG and multiplied digitally with the VPNM. The circuit implementation on rapid single flux quantum technology required practical circuit scales and bias currents, 279 junctions and 33 mA for the PRNG, and 1677 junctions and 218 mA for the VPNM. We confirmed the circuit operation with sufficiently wide margins, 80-120%, with respect to the designed bias currents.

  19. Modifications and Modelling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Ann E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of the Single Flow Cell Test Apparatus (SFCTA) in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. The SFCTA, which will be tested simultaneously, will provide data on alkali metal flow behavior through the simulated core channels and assist in the development of a second generation thermal simulator. Additionally, data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  20. Modifications and Modelling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Ann E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of the Single Flow Cell Test Apparatus (SFCTA) in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. The SFCTA, which will be tested simultaneously, will provide data on alkali metal flow behavior through the simulated core channels and assist in the development of a second generation thermal simulator. Additionally, data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  1. Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

    NASA Technical Reports Server (NTRS)

    Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

    2003-01-01

    The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

  2. Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

    NASA Technical Reports Server (NTRS)

    Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

    2003-01-01

    The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

  3. Neural mechanisms for filtering self-generated sensory signals in cerebellum-like circuits.

    PubMed

    Requarth, Tim; Sawtell, Nathaniel B

    2011-08-01

    This review focuses on recent progress in understanding mechanisms for filtering self-generated sensory signals in cerebellum-like circuits in fish and mammals. Recent in vitro studies in weakly electric gymnotid fish have explored the interplay among anti-Hebbian plasticity, synaptic dynamics, and feedforward inhibition in canceling self-generated electrosensory inputs. Studies of the mammalian dorsal cochlear nucleus have revealed multimodal integration and anti-Hebbian plasticity, suggesting that this circuit may adaptively filter incoming auditory information. In vivo studies in weakly electric mormryid fish suggest a key role for granule cell coding in sensory filtering. The clear links between synaptic plasticity and systems level sensory filtering in cerebellum-like circuits may provide insights into hypothesized adaptive filtering functions of the cerebellum itself.

  4. Optimal testing input sets for reduced diagnosis time of nuclear power plant digital electronic circuits

    SciTech Connect

    Kim, D.S.; Seong, P.H. . Dept. of Nuclear Engineering)

    1994-02-01

    This paper describes the optimal testing input sets required for the fault diagnosis of the nuclear power plant digital electronic circuits. With the complicated systems such as very large scale integration (VLSI), nuclear power plant (NPP), and aircraft, testing is the major factor of the maintenance of the system. Particularly, diagnosis time grows quickly with the complexity of the component. In this research, for reduce diagnosis time the authors derived the optimal testing sets that are the minimal testing sets required for detecting the failure and for locating of the failed component. For reduced diagnosis time, the technique presented by Hayes fits best for the approach to testing sets generation among many conventional methods. However, this method has the following disadvantages: (a) it considers only the simple network (b) it concerns only whether the system is in failed state or not and does not provide the way to locate the failed component. Therefore the authors have derived the optimal testing input sets that resolve these problems by Hayes while preserving its advantages. When they applied the optimal testing sets to the automatic fault diagnosis system (AFDS) which incorporates the advanced fault diagnosis method of artificial intelligence technique, they found that the fault diagnosis using the optimal testing sets makes testing the digital electronic circuits much faster than that using exhaustive testing input sets; when they applied them to test the Universal (UV) Card which is a nuclear power plant digital input/output solid state protection system card, they reduced the testing time up to about 100 times.

  5. Student-Generated Assignments about Electrical Circuits in a Computer Simulation

    ERIC Educational Resources Information Center

    Vreman-de Olde, Cornelise; de Jong, Ton

    2004-01-01

    In this study we investigated the design of assignments by students as a knowledge-generating activity. Students were required to design assignments for 'other students' in a computer simulation environment about electrical circuits. Assignments consisted of a question, alternatives, and feedback on those alternatives. In this way, subjects were…

  6. A versatile waveform generator for testing neuroelectric signal processors.

    PubMed

    Kohn, A F

    1989-08-01

    A multi-channel waveform generator was designed for testing neuroelectric signal processors. Smooth transient signals that resemble action potentials or evoked potentials are generated by a second order switched capacitor filter excited by brief rectangular pulses. The choice of an integrated circuit switched capacitor filter simplified the design by circumventing some of the disadvantages of conventional active filters. The waveform generator is versatile, with several signal parameters being independently adjustable from front panel controls: duration, waveshape, latency, amplitude and signal-to-noise ratio. The generator has been used for testing evoked potential acquisition and processing systems, for evaluating the effects of analog filters on evoked potentials and for testing systems designed to detect and classify trains of multi-unit action potentials.

  7. Striatal cholinergic interneurons generate beta and gamma oscillations in the corticostriatal circuit and produce motor deficits.

    PubMed

    Kondabolu, Krishnakanth; Roberts, Erik A; Bucklin, Mark; McCarthy, Michelle M; Kopell, Nancy; Han, Xue

    2016-05-31

    Cortico-basal ganglia-thalamic (CBT) neural circuits are critical modulators of cognitive and motor function. When compromised, these circuits contribute to neurological and psychiatric disorders, such as Parkinson's disease (PD). In PD, motor deficits correlate with the emergence of exaggerated beta frequency (15-30 Hz) oscillations throughout the CBT network. However, little is known about how specific cell types within individual CBT brain regions support the generation, propagation, and interaction of oscillatory dynamics throughout the CBT circuit or how specific oscillatory dynamics are related to motor function. Here, we investigated the role of striatal cholinergic interneurons (SChIs) in generating beta and gamma oscillations in cortical-striatal circuits and in influencing movement behavior. We found that selective stimulation of SChIs via optogenetics in normal mice robustly and reversibly amplified beta and gamma oscillations that are supported by distinct mechanisms within striatal-cortical circuits. Whereas beta oscillations are supported robustly in the striatum and all layers of primary motor cortex (M1) through a muscarinic-receptor mediated mechanism, gamma oscillations are largely restricted to the striatum and the deeper layers of M1. Finally, SChI activation led to parkinsonian-like motor deficits in otherwise normal mice. These results highlight the important role of striatal cholinergic interneurons in supporting oscillations in the CBT network that are closely related to movement and parkinsonian motor symptoms.

  8. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator.

    PubMed

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results.

  9. Investigation of DC hybrid circuit breaker based on high-speed switch and arc generator

    NASA Astrophysics Data System (ADS)

    Wu, Yifei; Rong, Mingzhe; Wu, Yi; Yang, Fei; Li, Mei; Zhong, Jianying; Han, Guohui; Niu, Chunping; Hu, Yang

    2015-02-01

    A new design of DC hybrid circuit breaker based on high-speed switch (HSS) and arc generator (AG), which can drastically profit from low heat loss in normal state and fast current breaking under fault state, is presented and analyzed in this paper. AG is designed according to the magnetic pinch effect of liquid metal. By utilizing the arc voltage generated across AG, the fault current is rapidly commutated from HSS into parallel connected branch. As a consequence, the arcless open of HSS is achieved. The post-arc conducting resume time (Δ tc) of AG and the commutation original voltage (Uc), two key factors in the commutation process, are investigated experimentally. Particularly, influences of the liquid metal channel diameter (Φ) of AG, fault current rate of rise (di/dt) and Uc on Δ tc are focused on. Furthermore, a suitable Uc is determined during the current commutation process, aiming at the reliable arcless open of HSS and short breaking time. Finally, the fault current breaking test is carried out for the current peak value of 11.8 kA, and the validity of the design is confirmed by the experimental results.

  10. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand...

  11. 42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand...

  12. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 47 Telecommunication 5 2011-10-01 2011-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit diagrams and testing equipment. (a) Each ship station must be provided with such tools, testing...

  13. Test Writing Made Simple: Generate Tests and Worksheets Electronically.

    ERIC Educational Resources Information Center

    Lodish, Erica

    1986-01-01

    Describes capabilities of test and worksheet generator software; discusses features to consider when evaluating the software for purchase; and presents reviews of eight test and worksheet generators: P.D.Q., Testmaster, Easy Quiz Maker, EA Mathematics Worksheet Generator, Mathematics Worksheet Generator, Earth Science Test Maker, Individualized…

  14. The Neural Circuits that Generate Tics in Gilles de la Tourette Syndrome

    PubMed Central

    Wang, Zhishun; Maia, Tiago V.; Marsh, Rachel; Colibazzi, Tiziano; Gerber, Andrew; Peterson, Bradley S.

    2014-01-01

    Objective To study neural activity and connectivity within cortico-striato-thalamo-cortical circuits and to reveal circuit-based neural mechanisms that govern tic generation in Tourette syndrome. Method We acquired fMRI data from 13 participants with Tourette syndrome and 21 controls during spontaneous or simulated tics. We used independent component analysis with hierarchical partner matching to isolate neural activity within functionally distinct regions of cortico-striato-thalamo-cortical circuits. We used Granger causality to investigate causal interactions among these regions. Results We found that the Tourette group exhibited stronger neural activity and interregional causality than controls throughout all portions of the motor pathway including sensorimotor cortex, putamen, pallidum, and substania nigra. Activity in these areas correlated positively with the severity of tic symptoms. Activity within the Tourette group was stronger during spontaneous tics than during voluntary tics in somatosensory and posterior parietal cortices, putamen, and amygdala/hippocampus complex, suggesting that activity in these regions may represent features of the premonitory urges that generate spontaneous tic behaviors. In contrast, activity was weaker in the Tourette group than in controls within portions of cortico-striato-thalamo-cortical circuits that exert top-down control over motor pathways (caudate and anterior cingulate cortex), and progressively less activity in these regions accompanied more severe tic symptoms, suggesting that faulty activity in these circuits may fail to control tic behaviors or the premonitory urges that generate them. Conclusions Our findings taken together suggest that tics are caused by the combined effects of excessive activity in motor pathways and reduced activation in control portions of cortico-striato-thalamo-cortical circuits. PMID:21955933

  15. Development and Simulation of Increased Generation on a Secondary Circuit of a Microgrid

    NASA Astrophysics Data System (ADS)

    Reyes, Karina

    As fossil fuels are depleted and their environmental impacts remain, other sources of energy must be considered to generate power. Renewable sources, for example, are emerging to play a major role in this regard. In parallel, electric vehicle (EV) charging is evolving as a major load demand. To meet reliability and resiliency goals demanded by the electricity market, interest in microgrids are growing as a distributed energy resource (DER). In this thesis, the effects of intermittent renewable power generation and random EV charging on secondary microgrid circuits are analyzed in the presence of a controllable battery in order to characterize and better understand the dynamics associated with intermittent power production and random load demands in the context of the microgrid paradigm. For two reasons, a secondary circuit on the University of California, Irvine (UCI) Microgrid serves as the case study. First, the secondary circuit (UC-9) is heavily loaded and an integral component of a highly characterized and metered microgrid. Second, a unique "next-generation" distributed energy resource has been deployed at the end of the circuit that integrates photovoltaic power generation, battery storage, and EV charging. In order to analyze this system and evaluate the impact of the DER on the secondary circuit, a model was developed to provide a real-time load flow analysis. The research develops a power management system applicable to similarly integrated systems. The model is verified by metered data obtained from a network of high resolution electric meters and estimated load data for the buildings that have unknown demand. An increase in voltage is observed when the amount of photovoltaic power generation is increased. To mitigate this effect, a constant power factor is set. Should the real power change dramatically, the reactive power is changed to mitigate voltage fluctuations.

  16. Dynamics of coupled simplest chaotic two-component electronic circuits and its potential application to random bit generation

    SciTech Connect

    Modeste Nguimdo, Romain; Tchitnga, Robert; Woafo, Paul

    2013-12-15

    We numerically investigate the possibility of using a coupling to increase the complexity in simplest chaotic two-component electronic circuits operating at high frequency. We subsequently show that complex behaviors generated in such coupled systems, together with the post-processing are suitable for generating bit-streams which pass all the NIST tests for randomness. The electronic circuit is built up by unidirectionally coupling three two-component (one active and one passive) oscillators in a ring configuration through resistances. It turns out that, with such a coupling, high chaotic signals can be obtained. By extracting points at fixed interval of 10 ns (corresponding to a bit rate of 100 Mb/s) on such chaotic signals, each point being simultaneously converted in 16-bits (or 8-bits), we find that the binary sequence constructed by including the 10(or 2) least significant bits pass statistical tests of randomness, meaning that bit-streams with random properties can be achieved with an overall bit rate up to 10×100 Mb/s =1Gbit/s (or 2×100 Mb/s =200 Megabit/s). Moreover, by varying the bias voltages, we also investigate the parameter range for which more complex signals can be obtained. Besides being simple to implement, the two-component electronic circuit setup is very cheap as compared to optical and electro-optical systems.

  17. Generation of Dicke states in the ultrastrong-coupling regime of circuit QED systems

    NASA Astrophysics Data System (ADS)

    Wu, Chunfeng; Guo, Chu; Wang, Yimin; Wang, Gangcheng; Feng, Xun-Li; Chen, Jing-Ling

    2017-01-01

    Ultrastrong coupling in circuit quantum electrodynamics makes enhanced fast quantum operations possible. We present a scheme to realize controllable qubit-resonator interactions in ultrastrong circuit quantum electrodynamics with the aid of a unitary transformation. The controllable qubit-resonator interaction is just one type of the so-called selective resonant interactions. From the effective dynamics, it is possible to create the multipartite Dicke states at nanoseconds with high fidelity if the large detuning constraint of the selective resonant interaction is fulfilled. We also investigate the performance of our scheme in the presence of decoherence. Our results present a promising way toward achieving enhanced fast generation of the Dicke states.

  18. Energy harvesting by dielectric elastomer generator and self-priming circuit: verification by radio transmission

    NASA Astrophysics Data System (ADS)

    Ikegame, Toru; Takagi, Kentaro; Ito, Takamasa; Kojima, Hiroki; Yoshikawa, Hitoshi

    2017-04-01

    This paper discusses energy harvesting and its application using dielectric elastomer and self-priming circuit. With the self-priming circuit attached to the dielectric elastomer, the generated voltage increases exponentially according to the variation of the capacitance caused by applied deformation to the elastomer. Two-stage self-priming circuit is selected for optimal harvesting. The self-priming harvesting technique is able to increase the voltage of the dielectric elastomer from a few volts to kV order, however in this paper the generated voltage is limited up to 1kV in order to avoid the destruction of the dielectric elastomer. The ability of energy harvesting using dielectric elastomer and self-priming circuit is confirmed by both numerical simulation and experiments. In the experiment, the dielectric elastomer is deformed by an electric motor, and the harvested energy is stored to a charging capacitor through Zener diodes. A low-power microcomputer which has a radio transmitter is connected to the charging capacitor for the application example. The experimental results show that the temperature data can be transmitted only by the harvested energy. In addition, the efficiency of the energy harvesting is calculated by comparing the generated power with the charged power.

  19. Automated Test-Form Generation

    ERIC Educational Resources Information Center

    van der Linden, Wim J.; Diao, Qi

    2011-01-01

    In automated test assembly (ATA), the methodology of mixed-integer programming is used to select test items from an item bank to meet the specifications for a desired test form and optimize its measurement accuracy. The same methodology can be used to automate the formatting of the set of selected items into the actual test form. Three different…

  20. Microfabrication and Cold Testing of Copper Circuits for a 50 Watt, 220 GHz Traveling Wave Tube

    DTIC Science & Technology

    2013-01-11

    microfabrication and cold test measurement results of serpentine waveguide amplifier circuits at 220 GHz. The circuits were fabricated using a novel embedded...techniques while simultaneously reducing cost and increasing yield. Fig. 1 shows a final serpentine waveguide traveling wave tube (SW-TWT...Government. Figure 1. (a) Photo of serpentine waveguide circuit with beam tunnel prior to brazing on a flat cover. Shown with 0.0072 inch

  1. Variable cooling circuit for thermoelectric generator and engine and method of control

    DOEpatents

    Prior, Gregory P

    2012-10-30

    An apparatus is provided that includes an engine, an exhaust system, and a thermoelectric generator (TEG) operatively connected to the exhaust system and configured to allow exhaust gas flow therethrough. A first radiator is operatively connected to the engine. An openable and closable engine valve is configured to open to permit coolant to circulate through the engine and the first radiator when coolant temperature is greater than a predetermined minimum coolant temperature. A first and a second valve are controllable to route cooling fluid from the TEG to the engine through coolant passages under a first set of operating conditions to establish a first cooling circuit, and from the TEG to a second radiator through at least some other coolant passages under a second set of operating conditions to establish a second cooling circuit. A method of controlling a cooling circuit is also provided.

  2. Split-cross-bridge resistor for testing for proper fabrication of integrated circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M. G. (Inventor)

    1985-01-01

    An electrical testing structure and method is described whereby a test structure is fabricated on a large scale integrated circuit wafer along with the circuit components and has a van der Pauw cross resistor in conjunction with a bridge resistor and a split bridge resistor, the latter having two channels each a line width wide, corresponding to the line width of the wafer circuit components, and with the two channels separated by a space equal to the line spacing of the wafer circuit components. The testing structure has associated voltage and current contact pads arranged in a two by four array for conveniently passing currents through the test structure and measuring voltages at appropriate points to calculate the sheet resistance, line width, line spacing, and line pitch of the circuit components on the wafer electrically.

  3. Note: Complementary metal-oxide-semiconductor high voltage pulse generation circuits

    NASA Astrophysics Data System (ADS)

    Sun, Jiwei; Wang, Pingshan

    2013-10-01

    We present two types of on-chip pulse generation circuits. The first is based on CMOS pulse-forming-lines (PFLs). It includes a four-stage charge pump, a four-stacked-MOSFET switch and a 5 mm long PFL. The circuit is implemented in a 0.13 μm CMOS process. Pulses of ˜1.8 V amplitude with ˜135 ps duration on a 50 Ω load are obtained. The obtained voltage is higher than 1.6 V, the rated operating voltage of the process. The second is a high-voltage Marx generator which also uses stacked MOSFETs as high voltage switches. The output voltage is 11.68 V, which is higher than the highest breakdown voltage (˜10 V) of the CMOS process. These results significantly extend high-voltage pulse generation capabilities of CMOS technologies.

  4. Note: Complementary metal-oxide-semiconductor high voltage pulse generation circuits.

    PubMed

    Sun, Jiwei; Wang, Pingshan

    2013-10-01

    We present two types of on-chip pulse generation circuits. The first is based on CMOS pulse-forming-lines (PFLs). It includes a four-stage charge pump, a four-stacked-MOSFET switch and a 5 mm long PFL. The circuit is implemented in a 0.13 μm CMOS process. Pulses of ~1.8 V amplitude with ~135 ps duration on a 50 Ω load are obtained. The obtained voltage is higher than 1.6 V, the rated operating voltage of the process. The second is a high-voltage Marx generator which also uses stacked MOSFETs as high voltage switches. The output voltage is 11.68 V, which is higher than the highest breakdown voltage (~10 V) of the CMOS process. These results significantly extend high-voltage pulse generation capabilities of CMOS technologies.

  5. Generator acceptance test and inspection report

    SciTech Connect

    Johns, B.R.

    1997-07-24

    This Acceptance Test Report(ATR) is the completed testing and inspection of the new portable generator. The testing and inspection is to verify that the generator provided by the vendor meets the requirements of specification WHC-S-0252, Revision 2. Attached is various other documentation to support the inspection and testing.

  6. Testing of printed circuit board solder joints by optical correlation

    NASA Technical Reports Server (NTRS)

    Espy, P. N.

    1975-01-01

    An optical correlation technique for the nondestructive evaluation of printed circuit board solder joints was evaluated. Reliable indications of induced stress levels in solder joint lead wires are achievable. Definite relations between the inherent strength of a solder joint, with its associated ability to survive stress, are demonstrable.

  7. Applications of laser-generated surface acoustic waves for copper film process monitoring in integrated circuit industry (abstract)

    NASA Astrophysics Data System (ADS)

    Gostein, Michael; Maznev, A. A.; Krastev, Plamen; Mazurenko, Alex

    2003-01-01

    We describe applications of a compact commercial instrument for laser generation and detection of surface acoustic waves (SAWs) to problems in metal film process control for the integrated circuit (IC) industry. [M. Gostein, M. Banet, M. Joffe, A. A. Maznev, R. Sacco, J. A. Rogers, and K. A. Nelson, in Handbook of Silicon Semiconductor Metrology, edited by A. C. Diebold (Marcel Dekker, New York, 2001)] The IC industry is undergoing dramatic changes with the continued drive to reduce feature size and increase circuit speed. One of the most important of these changes is the industry-wide move to replace circuit interconnect processes based on aluminum metallization with copper-based processes. The unique process challenges of copper metallization, coupled with the increasing cost of IC manufacturing in general, have resulted in an increased need for metal film thickness measurement for process control. Laser-generated and detected surface acoustic waves provide an ideal method for nondestructively measuring film thickness on product wafers as they move through an IC factory. A patented version of the technique has been incorporated into a commercial high-throughput measurement station. The measurement station analyzes specialized test structures in the scribe lines in between IC chips on a product wafer. Here, we describe application of the technique to all stages of the copper metallization process, including measurement of seed-layer copper and its associated underlying barrier metals, measurement of electroplated copper deposited atop the seed layer, and measurement of remaining copper film thickness following a chemical-mechanical polishing step. We highlight special capabilities to measure test arrays of submicron metal lines that closely resemble actual circuit elements. In addition, we discuss characterization of the elastic properties of typical and emerging thin film materials used in the semiconductor industry, which is a necessary step in setting up the

  8. Development and interrupting tests on 250KV 8KA HVDC circuit breaker

    SciTech Connect

    Tokuyama, S.; Arimatsu, K.; Hirata, K.; Kato, Y.; Yoshioka, Y.

    1985-09-01

    This paper describes the circuit and component selections, development and equivalent circuit test results on an HVDC circuit breaker for an HVDC transmission line. A puffer type SF/sub 6/ gas interrupter for AC circuit breakers is utilized for interrupting DC current with injection of high-frequency inverse current from a commutating capacitor precharged to HVDC line voltage. Also, the effectiveness of application of the HVDC breaker to an HVDC system with two parallel transmission lines is demonstrated through the EMTP simulation.

  9. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be classified according to the length of time it supplies air or oxygen to the breathing machine. (c)...

  10. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be classified according to the length of time it supplies air or oxygen to the breathing machine. (c)...

  11. 42 CFR 84.95 - Service time test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be classified according to the length of time it supplies air or oxygen to the breathing machine. (c)...

  12. Application of a new arc model for the evaluation of short-circuit breaking tests

    SciTech Connect

    Habedank, U. )

    1993-10-01

    A new arc model is introduced, which describes the behavior of a circuit-breaker using four constant parameters. Comparison of measurement and calculation shows that the description is relatively exact. By means of this model more information about the arc quenching capability of a circuit-breaker can be obtained from switching tests than was possible up to now. Examples are given.

  13. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating current equipment and their auxiliary devices shall be tested and examined at least once each month by a person... circuit breaker and its auxiliary devices shall be visually examined and such repairs or adjustments as...

  14. Hospital generator sizing, testing, and exercising.

    PubMed

    Nash, H O

    1994-02-01

    With the NFPA 99 and JCAHO requirements for minimum loads on generators during testing, hospital engineers are finding that oversized standby generators can mean operational problems. This document explains the oversized generator problem, including the code changes that gave birth to the problem. Some practical suggestions for sizing generators are then provided.

  15. Development and performance testing of a 200 kVA damperless superconducting generator

    SciTech Connect

    Suryanarayana, T.; Bhattacharya, J.L.; Raju, K.S.N.; Durga Prasad, K.A.

    1997-12-01

    A 200 kVA, 3,000 RPM superconducting generator has been developed and tested. The rotor has been wound with superconducting wire of Nb-Ti alloy. A closed-circuit liquid helium system has been designed and installed for cooling the superconducting windings. The stator carries the air-gap type armature windings and a laminated-iron flux-shield. A new concept in the design of superconducting generators with high short-circuit ratio (more than 5) has been introduced. This eliminates the requirement of Electro-magnetic Damper (EMD) and Quick Response Excitation System (QRES). The generator has been comprehensively tested in superconducting state. Open-circuit and sustained short-circuit tests, 3-phase sudden short-circuit test, synchronization with grid and parallel operation with power system have been conducted. The synchronous machine was operated up to its rated kVA in the four quadrants--as generator and as condenser with leading and lagging power factors. A few special tests on superconducting generator, which were not reported earlier, such as direct-on-line starting of a 20 HP squirrel-cage induction motor and negative phase sequence tests have also been performed successfully. Test results and conclusions are given in the paper.

  16. Field testing of overcurrent trip units for low voltage circuit breakers used in DC applications

    SciTech Connect

    Davis, E.L.; Funk, D.L.

    1994-08-01

    This Tech Note investigates and provides recommendations for field testing the overcurrent trip units of low voltage circuit breakers used in direct current (DC) applications. Although industry guidance is available for field testing low voltage circuit breakers in alternating current (AC) applications, guidance for testing breakers used in DC circuits is virtually nonexistent. Fault theory and breaker operating principles are discussed at a depth necessary to technically substantiate recommended practices contained in this Tech Note. The response of low voltage circuit breaker overcurrent trip units to AC and DC current is compared to facilitate an understanding of the issues and concerns surrounding overcurrent test methods for low voltage circuit breakers used in dc applications. The applicability of this information to a test program for DC system breakers is described in detail. This Tech Note addresses whether or not overcurrent test results obtained using UAC current are representative of a breaker`s performance under DC conditions. This document demonstrates that technically valid test results can be obtained using either AC or DC test methods. The final recommendations presented favor AC testing over DC testing based on familiarity with the test method and economic considerations; however, it is stressed that either test method can yield technically acceptable results. The potential benefits and limitations of each test method, AC or DC, should be understood thoroughly before selecting a test method or interpreting test results.

  17. Feedback from network states generates variability in a probabilistic olfactory circuit

    PubMed Central

    Gordus, Andrew; Pokala, Navin; Levy, Sagi; Flavell, Steven W.; Bargmann, Cornelia I

    2016-01-01

    Summary Variability is a prominent feature of behavior, and an active element of certain behavioral strategies. To understand how neuronal circuits control variability, we examined the propagation of sensory information in a chemotaxis circuit of Caenorhabditis elegans where discrete sensory inputs can drive a probabilistic behavioral response. Olfactory neurons respond to odor stimuli with rapid and reliable changes in activity, but downstream AIB interneurons respond with a probabilistic delay. The interneuron response to odor depends on the collective activity of multiple neurons – AIB, RIM, and AVA -- when the odor stimulus arrives. Certain activity states of the network correlate with reliable responses to odor stimuli. Artificially generating these activity states by modifying neuronal activity increases the reliability of odor responses in interneurons and the reliability of the behavioral response to odor. The integration of sensory information with network state may represent a general mechanism for generating variability in behavior. PMID:25772698

  18. Quantum Approaches to Logic Circuit Synthesis and Testing

    DTIC Science & Technology

    2006-06-01

    STATEMENT APPROVED FOR PUBLIC RELEASE; DISTRIBUTION UNLIMITED. PA#06-445 13. SUPPLEMENTARY NOTES 14 . ABSTRACT The overall objective of this...i Table of Contents 1. Executive Summary 1 2. Introduction 2 3. Synthesis of Quantum Circuits 14 4...used by the Apply operation with xi = Var( vf ), xj = Var(vg) and xi < xj meaning that that xi precedes xj in the variable ordering. 11

  19. Automated Test Requirement Document Generation

    DTIC Science & Technology

    1987-11-01

    DIAGNOSTICS BASED ON THE PRINCIPLES OF ARTIFICIAL INTELIGENCE ", 1984 International Test Conference, 01Oct84, (A3, 3, Cs D3, E2, G2, H2, 13, J6, K) 425...j0O GLOSSARY OF ACRONYMS 0 ABBREVIATION DEFINITION AFSATCOM Air Force Satellite Communication Al Artificial Intelligence ASIC Application Specific...In-Test Equipment (BITE) and AI ( Artificial Intelligence) - Expert Systems - need to be fully applied before a completely automated process can be

  20. Electronic load for testing power generating devices

    NASA Technical Reports Server (NTRS)

    Friedman, E. B.; Stepfer, G.

    1968-01-01

    Instrument tests various electric power generating devices by connecting the devices to the input of the load and comparing their outputs with a reference voltage. The load automatically adjusts until voltage output of the power generating device matches the reference.

  1. Architectures and Design for Next-Generation Hybrid Circuit/Packet Networks

    NASA Astrophysics Data System (ADS)

    Vadrevu, Sree Krishna Chaitanya

    Internet traffic is increasing rapidly at an annual growth rate of 35% with aggregate traffic exceeding several Exabyte's per month. The traffic is also becoming heterogeneous in bandwidth and quality-of-service (QoS) requirements with growing popularity of cloud computing, video-on-demand (VoD), e-science, etc. Hybrid circuit/packet networks which can jointly support circuit and packet services along with the adoption of high-bit-rate transmission systems form an attractive solution to address the traffic growth. 10 Gbps and 40 Gbps transmission systems are widely deployed in telecom backbone networks such as Comcast, AT&T, etc., and network operators are considering migration to 100 Gbps and beyond. This dissertation proposes robust architectures, capacity migration strategies, and novel service frameworks for next-generation hybrid circuit/packet architectures. In this dissertation, we study two types of hybrid circuit/packet networks: a) IP-over-WDM networks, in which the packet (IP) network is overlaid on top of the circuit (optical WDM) network and b) Hybrid networks in which the circuit and packet networks are deployed side by side such as US DoE's ESnet. We investigate techniques to dynamically migrate capacity between the circuit and packet sections by exploiting traffic variations over a day, and our methods show that significant bandwidth savings can be obtained with improved reliability of services. Specifically, we investigate how idle backup circuit capacity can be used to support packet services in IP-over-WDM networks, and similarly, excess capacity in packet network to support circuit services in ESnet. Control schemes that enable our mechanisms are also discussed. In IP-over-WDM networks, with upcoming 100 Gbps and beyond, dedicated protection will induce significant under-utilization of backup resources. We investigate design strategies to loan idle circuit backup capacity to support IP/packet services. However, failure of backup circuits will

  2. A Novel Picosecond Pulse Generation Circuit Based on SRD and NLTL

    PubMed Central

    Zhou, Jianming; Lu, Qiuyuan; Liu, Fan; Li, Yinqiao

    2016-01-01

    Because of the importance of ultra-wideband (UWB) radar in various applications, short pulse generation in UWB systems has attracted a lot of attention in recent years. In order to shorten the pulse, nonlinear transmission line (NLTL) is imported, which expands the application of step recovery diode (SRD) for pulse generation. Detailed analysis and equations for this SRD and NLTL-based pulse generation are provided and verified by simulation and experimental results. Factors that could cause pulse waveform distortions are also analyzed. The generator circuit presented in this paper generates 130ps and 3.3V pulse, which can be used in UWB radar systems that require sub-nanosecond pulses. PMID:26919290

  3. A Novel Picosecond Pulse Generation Circuit Based on SRD and NLTL.

    PubMed

    Zhou, Jianming; Lu, Qiuyuan; Liu, Fan; Li, Yinqiao

    2016-01-01

    Because of the importance of ultra-wideband (UWB) radar in various applications, short pulse generation in UWB systems has attracted a lot of attention in recent years. In order to shorten the pulse, nonlinear transmission line (NLTL) is imported, which expands the application of step recovery diode (SRD) for pulse generation. Detailed analysis and equations for this SRD and NLTL-based pulse generation are provided and verified by simulation and experimental results. Factors that could cause pulse waveform distortions are also analyzed. The generator circuit presented in this paper generates 130ps and 3.3V pulse, which can be used in UWB radar systems that require sub-nanosecond pulses.

  4. Experimental Durability Testing of 4H SiC JFET Integrated Circuit Technology at 727 C

    NASA Technical Reports Server (NTRS)

    Spry, David; Neudeck, Phil; Chen, Liangyu; Chang, Carl; Lukco, Dorothy; Beheim, Glenn M

    2016-01-01

    We have reported SiC integrated circuits (IC's) with two levels of metal interconnect that have demonstrated prolonged operation for thousands of hours at their intended peak ambient operational temperature of 500 C [1, 2]. However, it is recognized that testing of semiconductor microelectronics at temperatures above their designed operating envelope is vital to qualification. Towards this end, we previously reported operation of a 4H-SiC JFET IC ring oscillator on an initial fast thermal ramp test through 727 C [3]. However, this thermal ramp was not ended until a peak temperature of 880 C (well beyond failure) was attained. Further experiments are necessary to better understand failure mechanisms and upper temperature limit of this extreme-temperature capable 4H-SiC IC technology. Here we report on additional experimental testing of custom-packaged 4H-SiC JFET IC devices at temperatures above 500 C. In one test, the temperature was ramped and then held at 727 C, and the devices were periodically measured until electrical failure was observed. A 4H-SiC JFET on this chip electrically functioned with little change for around 25 hours at 727 C before rapid increases in device resistance caused failure. In a second test, devices from our next generation 4H-SiC JFET ICs were ramped up and then held at 700 C (which is below the maximum deposition temperature of the dielectrics). Three ring oscillators functioned for 8 hours at this temperature before degradation. In a third experiment, an alternative die attach of gold paste and package lid was used, and logic circuit operation was demonstrated for 143.5 hours at 700 C.

  5. Development of improved methods for type testing present day medium voltage circuit breakers for outdoor service

    SciTech Connect

    Kuznetsov, S.B.; Spindle, H.E. )

    1993-01-01

    Many of the standards for required fault current interrupting tests for circuit breakers rated at 15 to 72.5 kV were written for oil breakers or magnetically blasted air circuit breakers. In either case the interrupting medium which is produced by vaporizing, decomposing and ionizing the materials in the immediate vicinity of the arc is gas either mostly hydrogen for oil circuit breakers or air for magnetically blasted circuit breakers. These circuit breakers were primarily limited by the total current flowing through the breaker and by the peak voltage applied to the breaker after interruption. Consequently the test circuit requirements for standards were written to provide a sensible compromise between the system requirements and the capabilities of the testing facilities available. Today vacuum and gas circuit interrupters dominate this entire range of voltages and the entire range of interrupting currents for breakers in this voltage range. This paper examines test methods to cover the switching requirements for new systems and operating methods.

  6. Initial Testing of the Stainless Steel NaK-Cooled Circuit (SNaKC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne; Godfroy, Thomas

    2007-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK) was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around the 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. This presentation addresses the construction, fill and initial testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  7. Exploration of Digital Circuits and Transistor-Level Testing in the DARPA TRUST Program

    DTIC Science & Technology

    2015-03-01

    Master’s Thesis Oct 2013– Mar 2015 Exploration Of Digital Circuits And Transistor-Level Testing In The DARPA TRUST Program JON14G150 Tatum, Ralph K., Second... EXPLORATION OF DIGITAL CIRCUITS AND TRANSISTOR-LEVEL TESTING IN THE DARPA TRUST PROGRAM THESIS Ralph K. Tatum, Second Lieutenant, USAF AFIT-ENG-MS-15...Government and is not subject to copyright protection in the United States. AFIT-ENG-MS-15-M-040 EXPLORATION OF DIGITAL CIRCUITS AND TRANSISTOR-LEVEL

  8. F-1 Engine Gas Generator Testing

    NASA Image and Video Library

    The gas generator from an F-1 engine is test-fired at the Marshall Space Flight Center in Huntsville, Ala., on Jan. 24, 2013. Data from the 30 second test will be used in the development of advance...

  9. Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits

    NASA Technical Reports Server (NTRS)

    Bennett, K.; Lala, P. K.; Busaba, F.

    1997-01-01

    Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor level and this technique is based on analyzing the off-set of the function during off-line testing.

  10. Novel technique for reliability testing of silicon integrated circuits

    NASA Astrophysics Data System (ADS)

    LeMinh, Phuong; Wallinga, H.; Woerlee, P. H.; van den Berg, Albert; Holleman, J.

    2001-04-01

    We propose a simple, inexpensive technique with high resolution to identify the weak spots in integrated circuits by means of a non-destructive photochemical process in which photoresist is used as the photon detection tool. The experiment was done to localize the breakdown link of thin silicon dioxide capacitors of 5 X 5 and 10 X 10 micrometer2 in sizes. Both positive and quasi-negative photoresists were employed. The resultant products are holes in the developed positive photoresist layer and mushroom- shaped spots in the quasi-negative one. Based on the photoresist decomposition energy dose, we could approximately calculate the light emitting power in the near UV range. Due to the proximity between the layer and the light source, the power is interpreted on a more accurate basis, which was a difficult task in previous research. The product sizes, dependent on the light emitting currents and exposure time, establish the core for a rough model that can be used for further application of this technique as a reliability analysis tool. One potential application is to detect and characterize regions of hot carriers on a VLSI circuit under operation for design improvement purpose.

  11. A miniature microcontroller curve tracing circuit for space flight testing transistors.

    PubMed

    Prokop, N; Greer, L; Krasowski, M; Flatico, J; Spina, D

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results.

  12. Microfabrication and cold testing of copper circuits for a 50-watt 220-GHz traveling wave tube

    NASA Astrophysics Data System (ADS)

    Joye, Colin D.; Cook, Alan M.; Calame, Jeffrey P.; Abe, David K.; Vlasov, Alexander N.; Chernyavskiy, Igor A.; Nguyen, Khanh T.; Wright, Edward L.

    2013-03-01

    We present the microfabrication and cold test measurement results of serpentine waveguide amplifier circuits at 220 GHz. The circuits were fabricated using a novel embedded polymer monofilament technique combined with Ultraviolet- LIGA to simultaneously create both the beam tunnel and interaction circuits. We find remarkable characteristic matches between the measurements of the best circuits, illustrating that the process developed is able to create repeatable, highly precise circuits with high yield. It was found that slight beam tunnel misalignment can cause very strong stopbands to appear in the operating band due to bi- or quasi-periodicity. The NRL code TESLA-SW/FW has been used to rapidly simulate the as-built structure under a variety of conditions to accurately predict the performance with an electron beam. The tolerances needed on beam tunnel alignment are studied, with implications extending to the THz range.

  13. A miniature microcontroller curve tracing circuit for space flight testing transistors

    NASA Astrophysics Data System (ADS)

    Prokop, N.; Greer, L.; Krasowski, M.; Flatico, J.; Spina, D.

    2015-02-01

    This paper describes a novel miniature microcontroller based curve tracing circuit, which was designed to monitor the environmental effects on Silicon Carbide Junction Field Effect Transistor (SiC JFET) device performance, while exposed to the low earth orbit environment onboard the International Space Station (ISS) as a resident experiment on the 7th Materials on the International Space Station Experiment (MISSE7). Specifically, the microcontroller circuit was designed to operate autonomously and was flown on the external structure of the ISS for over a year. This curve tracing circuit is capable of measuring current vs. voltage (I-V) characteristics of transistors and diodes. The circuit is current limited for low current devices and is specifically designed to test high temperature, high drain-to-source resistance SiC JFETs. The results of each I-V data set are transmitted serially to an external telemetered communication interface. This paper discusses the circuit architecture, its design, and presents example results.

  14. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be... compressed-breathing-gas containers are tested, the flow test shall also be made with 3,450 kN/m.2 (500...

  15. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be... compressed-breathing-gas containers are tested, the flow test shall also be made with 3,450 kN/m.2 (500...

  16. 42 CFR 84.93 - Gas flow test; open-circuit apparatus.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be... compressed-breathing-gas containers are tested, the flow test shall also be made with 3,450 kN/m.2 (500...

  17. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED

    PubMed Central

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-01-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit. PMID:27562055

  18. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED.

    PubMed

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-08-26

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit.

  19. Generation of a macroscopic entangled coherent state using quantum memories in circuit QED

    NASA Astrophysics Data System (ADS)

    Liu, Tong; Su, Qi-Ping; Xiong, Shao-Jie; Liu, Jin-Ming; Yang, Chui-Ping; Nori, Franco

    2016-08-01

    W-type entangled states can be used as quantum channels for, e.g., quantum teleportation, quantum dense coding, and quantum key distribution. In this work, we propose a way to generate a macroscopic W-type entangled coherent state using quantum memories in circuit QED. The memories considered here are nitrogen-vacancy center ensembles (NVEs), each located in a different cavity. This proposal does not require initially preparing each NVE in a coherent state instead of a ground state, which should significantly reduce its experimental difficulty. For most of the operation time, each cavity remains in a vacuum state, thus decoherence caused by the cavity decay and the unwanted inter-cavity crosstalk are greatly suppressed. Moreover, only one external-cavity coupler qubit is needed, which simplifies the circuit.

  20. Electric circuits of the disturbed magnetosphere-ionosphere system and their generators

    NASA Astrophysics Data System (ADS)

    Mishin, V. M.; Bazarzhapov, A. D.; Sukhbaatar, U.; Förster, M.

    2010-12-01

    The simplest theory of electric circuits is applied to analysis of the observed large-scale electric field and currents in a disturbed magnetosphere-ionosphere system. Maps of distribution of field-aligned currents (FACs) obtained from ground-based magnetic measurements using the original magnetogram inversion method (MIT) and measurements by satellites were used. A method for circuit determination according to the data of such maps based on the detection of spatial R.N inhomogeneities in each of three Iijima and Potemra FAC zones is proposed. The results of the new method are used to describe some electric field and current generators not known before, new types of current systems in tail lobes and plasma sheet, and the formation and dynamics of new types of three-dimensional systems with auroral electrojets and meridional ionospheric Pedersen current, which have not been paid due attention in the literature.

  1. Photonic integrated circuit for all-optical millimeter-wave signal generation

    SciTech Connect

    Vawter, G.A.; Mar, A.; Zolper, J.; Hietala, V.

    1997-03-01

    Generation of millimeter-wave electronic signals and power is required for high-frequency communication links, RADAR, remote sensing and other applications. However, in the 30 to 300 GHz mm-wave regime, signal sources are bulky and inefficient. All-optical generation of mm-wave signals promises to improve efficiency to as much as 30 to 50 percent with output power as high as 100 mW. All of this may be achieved while taking advantage of the benefits of monolithic integration to reduce the overall size to that of a single semiconductor chip only a fraction of a square centimeter in size. This report summarizes the development of the first monolithically integrated all-optical mm-wave signal generator ever built. The design integrates a mode-locked semiconductor ring diode laser with an optical amplifier and high-speed photodetector into a single optical integrated circuit. Frequency generation is demonstrated at 30, 60 and 90 Ghz.

  2. Revised evaluation of steam generator testing alternatives

    SciTech Connect

    1981-01-01

    A scoping evaluation was made of various facility alternatives for test of LMFBR prototype steam generators and models. Recommendations are given for modifications to EBR-II and SCTI (Sodium Components Test Installation) for prototype SG testing, and for few-tube model testing. (DLC)

  3. A hybrid electrical/chemical circuit in the spinal cord generates a transient embryonic motor behavior.

    PubMed

    Knogler, Laura D; Ryan, Joel; Saint-Amant, Louis; Drapeau, Pierre

    2014-07-16

    Spontaneous network activity is a highly stereotyped early feature of developing circuits throughout the nervous system, including in the spinal cord. Spinal locomotor circuits produce a series of behaviors during development before locomotion that reflect the continual integration of spinal neurons into a functional network, but how the circuitry is reconfigured is not understood. The first behavior of the zebrafish embryo (spontaneous coiling) is mediated by an electrical circuit that subsequently generates mature locomotion (swimming) as chemical neurotransmission develops. We describe here a new spontaneous behavior, double coiling, that consists of two alternating contractions of the tail in rapid succession. Double coiling was glutamate-dependent and required descending hindbrain excitation, similar to but preceding swimming, making it a discrete intermediary developmental behavior. At the cellular level, motoneurons had a distinctive glutamate-dependent activity pattern that correlated with double coiling. Two glutamatergic interneurons, CoPAs and CiDs, had different activity profiles during this novel behavior. CoPA neurons failed to show changes in activity patterns during the period in which double coiling appears, whereas CiD neurons developed a glutamate-dependent activity pattern that correlated with double coiling and they innervated motoneurons at that time. Additionally, double coils were modified after pharmacological reduction of glycinergic neurotransmission such that embryos produced three or more rapidly alternating coils. We propose that double coiling behavior represents an important transition of the motor network from an electrically coupled spinal cord circuit that produces simple periodic coils to a spinal network driven by descending chemical neurotransmission, which generates more complex behaviors.

  4. Method of boundary testing of the electric circuits and its application for calculating electric tolerances. [electric equipment tests

    NASA Technical Reports Server (NTRS)

    Redkina, N. P.

    1974-01-01

    Boundary testing of electric circuits includes preliminary and limiting tests. Preliminary tests permit determination of the critical parameters causing the greatest deviation of the output parameter of the system. The boundary tests offer the possibility of determining the limits of the fitness of the system with simultaneous variation of its critical parameters.

  5. Testing Procedures for Closed-Circuit and Semi-Closed Circuit Underwater Breathing Apparatus

    DTIC Science & Technology

    1974-01-29

    a water or mercury manometer prior to each major test. Recheck calibration at the end of the test. The flowmeters are factory calibrated and should...calibrated against a water or mercury manometer ; the thermisters against 321F. water and room temperature. c. The flowmeter and gauges normally do not need... mercury manometer ; the thermistors against 320 F water and room temperature. 3) The flowmeter and gauges normally do not need daily calibration. 4) All

  6. Development of a Novel Test Method for On-Demand Internal Short Circuit in a Li-Ion Cell (Presentation)

    SciTech Connect

    Keyser, M.; Long, D.; Jung, Y. S.; Pesaran, A.; Darcy, E.; McCarthy, B.; Patrick, L.; Kruger, C.

    2011-01-01

    This presentation describes a cell-level test method that simulates an emergent internal short circuit, produces consistent and reproducible test results, can establish the locations and temperatures/power/SOC conditions where an internal short circuit will result in thermal runaway, and provides relevant data to validate internal short circuit models.

  7. Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G. (Inventor); Blaes, Brent R. (Inventor); Nixon, Robert H. (Inventor); Soli, George A. (Inventor)

    1995-01-01

    A method for predicting the SEU susceptibility of a standard-cell D-latch using an alpha-particle sensitive SRAM, SPICE critical charge simulation results, and alpha-particle interaction physics. A technique utilizing test structures to quickly and inexpensively characterize the SEU sensitivity of standard cell latches intended for use in a space environment. This bench-level approach utilizes alpha particles to induce upsets in a low LET sensitive 4-k bit test SRAM. This SRAM consists of cells that employ an offset voltage to adjust their upset sensitivity and an enlarged sensitive drain junction to enhance the cell's upset rate.

  8. Design and testing of an active quenching circuit for an avalanche photodiode photon detector

    NASA Technical Reports Server (NTRS)

    Arbel, D.; Schwartz, J. A.

    1991-01-01

    The photon-detection capabilities of avalanche photodiodes (APDs) operating above their theoretical breakdown voltages are described, with particular attention given to the needs and methods of quenching an avalanche once breakdown has occurred. A brief background on the motives of and previous work with this mode of operation is presented. Finally, a description of the design and testing of an active quenching circuit is given. Although the active quenching circuit did not perform as expected, knowledge was gained as to the signal amplitudes necessary for quenching and the need for a better model for the above-breakdown circuit characteristics of the Geiger-mode APD.

  9. Design and testing of an active quenching circuit for an avalanche photodiode photon detector

    NASA Technical Reports Server (NTRS)

    Arbel, D.; Schwartz, J. A.

    1991-01-01

    The photon-detection capabilities of avalanche photodiodes (APDs) operating above their theoretical breakdown voltages are described, with particular attention given to the needs and methods of quenching an avalanche once breakdown has occurred. A brief background on the motives of and previous work with this mode of operation is presented. Finally, a description of the design and testing of an active quenching circuit is given. Although the active quenching circuit did not perform as expected, knowledge was gained as to the signal amplitudes necessary for quenching and the need for a better model for the above-breakdown circuit characteristics of the Geiger-mode APD.

  10. Addressable Inverter Matrix Tests Integrated-Circuit Wafer

    NASA Technical Reports Server (NTRS)

    Buehler, Martin G.

    1988-01-01

    Addressing elements indirectly through shift register reduces number of test probes. With aid of new technique, complex test structure on silicon wafer tested with relatively small number of test probes. Conserves silicon area by reduction of area devoted to pads. Allows thorough evaluation of test structure characteristics and of manufacturing process parameters. Test structure consists of shift register and matrix of inverter/transmission-gate cells connected to two-by-ten array of probe pads. Entire pattern contained in square area having only 1.6-millimeter sides. Shift register is conventional static CMOS device using inverters and transmission gates in master/slave D flip-flop configuration.

  11. Generating Test Templates via Automated Theorem Proving

    NASA Technical Reports Server (NTRS)

    Kancherla, Mani Prasad

    1997-01-01

    Testing can be used during the software development process to maintain fidelity between evolving specifications, program designs, and code implementations. We use a form of specification-based testing that employs the use of an automated theorem prover to generate test templates. A similar approach was developed using a model checker on state-intensive systems. This method applies to systems with functional rather than state-based behaviors. This approach allows for the use of incomplete specifications to aid in generation of tests for potential failure cases. We illustrate the technique on the cannonical triangle testing problem and discuss its use on analysis of a spacecraft scheduling system.

  12. Modifications to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIp, provided by Idaho National Laboratory (INL), is the subject of the first round ofexperimentation. This paper provides a summary of the tests conducted on the original circuit, details the physical changes that have since been made to it, and describes the current test program.

  13. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1992-01-01

    A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Temperature definition and vibration tests are performed next. Final assembly testing is performed to simulate the Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation. Verification is successful when all components and final assemblies have passed each test. This method was very successful in verifying that commercial printed-circuit boards will survive in the Shuttle environment.

  14. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1992-01-01

    A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Temperature definition and vibration tests are performed next. Final assembly testing is performed to simulate the Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation. Verification is successful when all components and final assemblies have passed each test. This method was very successful in verifying that commercial printed-circuit boards will survive in the Shuttle environment.

  15. Mechanisms of left-right coordination in mammalian locomotor pattern generation circuits: a mathematical modeling view.

    PubMed

    Molkov, Yaroslav I; Bacak, Bartholomew J; Talpalar, Adolfo E; Rybak, Ilya A

    2015-05-01

    The locomotor gait in limbed animals is defined by the left-right leg coordination and locomotor speed. Coordination between left and right neural activities in the spinal cord controlling left and right legs is provided by commissural interneurons (CINs). Several CIN types have been genetically identified, including the excitatory V3 and excitatory and inhibitory V0 types. Recent studies demonstrated that genetic elimination of all V0 CINs caused switching from a normal left-right alternating activity to a left-right synchronized "hopping" pattern. Furthermore, ablation of only the inhibitory V0 CINs (V0D subtype) resulted in a lack of left-right alternation at low locomotor frequencies and retaining this alternation at high frequencies, whereas selective ablation of the excitatory V0 neurons (V0V subtype) maintained the left-right alternation at low frequencies and switched to a hopping pattern at high frequencies. To analyze these findings, we developed a simplified mathematical model of neural circuits consisting of four pacemaker neurons representing left and right, flexor and extensor rhythm-generating centers interacting via commissural pathways representing V3, V0D, and V0V CINs. The locomotor frequency was controlled by a parameter defining the excitation of neurons and commissural pathways mimicking the effects of N-methyl-D-aspartate on locomotor frequency in isolated rodent spinal cord preparations. The model demonstrated a typical left-right alternating pattern under control conditions, switching to a hopping activity at any frequency after removing both V0 connections, a synchronized pattern at low frequencies with alternation at high frequencies after removing only V0D connections, and an alternating pattern at low frequencies with hopping at high frequencies after removing only V0V connections. We used bifurcation theory and fast-slow decomposition methods to analyze network behavior in the above regimes and transitions between them. The model

  16. Mechanisms of Left-Right Coordination in Mammalian Locomotor Pattern Generation Circuits: A Mathematical Modeling View

    PubMed Central

    Talpalar, Adolfo E.; Rybak, Ilya A.

    2015-01-01

    The locomotor gait in limbed animals is defined by the left-right leg coordination and locomotor speed. Coordination between left and right neural activities in the spinal cord controlling left and right legs is provided by commissural interneurons (CINs). Several CIN types have been genetically identified, including the excitatory V3 and excitatory and inhibitory V0 types. Recent studies demonstrated that genetic elimination of all V0 CINs caused switching from a normal left-right alternating activity to a left-right synchronized “hopping” pattern. Furthermore, ablation of only the inhibitory V0 CINs (V0D subtype) resulted in a lack of left-right alternation at low locomotor frequencies and retaining this alternation at high frequencies, whereas selective ablation of the excitatory V0 neurons (V0V subtype) maintained the left–right alternation at low frequencies and switched to a hopping pattern at high frequencies. To analyze these findings, we developed a simplified mathematical model of neural circuits consisting of four pacemaker neurons representing left and right, flexor and extensor rhythm-generating centers interacting via commissural pathways representing V3, V0D, and V0V CINs. The locomotor frequency was controlled by a parameter defining the excitation of neurons and commissural pathways mimicking the effects of N-methyl-D-aspartate on locomotor frequency in isolated rodent spinal cord preparations. The model demonstrated a typical left-right alternating pattern under control conditions, switching to a hopping activity at any frequency after removing both V0 connections, a synchronized pattern at low frequencies with alternation at high frequencies after removing only V0D connections, and an alternating pattern at low frequencies with hopping at high frequencies after removing only V0V connections. We used bifurcation theory and fast-slow decomposition methods to analyze network behavior in the above regimes and transitions between them. The model

  17. Description and test results of a variable speed, constant frequency generating system

    NASA Technical Reports Server (NTRS)

    Brady, F. J.

    1985-01-01

    The variable-speed, constant frequency generating system developed for the Mod-0 wind turbine is presented. This report describes the system as it existed at the conclusion of the project. The cycloconverter control circuit is described including the addition of field-oriented control. The laboratory test and actual wind turbine test results are included.

  18. Description and test results of a variable speed, constant frequency generating system

    NASA Astrophysics Data System (ADS)

    Brady, F. J.

    1985-12-01

    The variable-speed, constant frequency generating system developed for the Mod-0 wind turbine is presented. This report describes the system as it existed at the conclusion of the project. The cycloconverter control circuit is described including the addition of field-oriented control. The laboratory test and actual wind turbine test results are included.

  19. Mobile testing complex based on an explosive magnetic generator

    NASA Astrophysics Data System (ADS)

    Shurupov, A. V.; Kozlov, A. V.; Gusev, A. N.; Shurupova, N. P.; Zavalova, V. E.; Chulkov, A. N.; Bazelyan, E. M.

    2015-01-01

    A mobile testing complex prototype on the basis of an explosive magnetic generator (MTC EMG) is developed to simulate a lightning current pulse. The main element of this complex is a current pulse generator comprising a EMG with a pulse transformer for energy release into the load. The electric chain of the MTC EMG is theoretically analyzed taking into consideration energy losses in active resistances in the primary circuit of the transformer and the inductive-resistive nature of the load, which resulted in the minimization of energy losses in the primary circuit depending on the electric chain parameters. It was found that, if the energy losses are minimized, the efficiency of transferring the EMG energy into the load exceeds 50%. As a result of the field tests of the MTC EMG, its basic characteristics were determined and the waveforms of the current pulses and voltages in the load were obtained. It is shown that the results of the mathematical simulation of current pulses in the load are in good agreement with the experimental data.

  20. Self-Testing Quantum Random Number Generator

    NASA Astrophysics Data System (ADS)

    Lunghi, Tommaso; Brask, Jonatan Bohr; Lim, Charles Ci Wen; Lavigne, Quentin; Bowles, Joseph; Martin, Anthony; Zbinden, Hugo; Brunner, Nicolas

    2015-04-01

    The generation of random numbers is a task of paramount importance in modern science. A central problem for both classical and quantum randomness generation is to estimate the entropy of the data generated by a given device. Here we present a protocol for self-testing quantum random number generation, in which the user can monitor the entropy in real time. Based on a few general assumptions, our protocol guarantees continuous generation of high quality randomness, without the need for a detailed characterization of the devices. Using a fully optical setup, we implement our protocol and illustrate its self-testing capacity. Our work thus provides a practical approach to quantum randomness generation in a scenario of trusted but error-prone devices.

  1. Test and verification of a reactor protection system application-specific integrated circuit

    SciTech Connect

    Battle, R.E.; Turner, G.W.; Vandermolen, R.I.; Vitalbo, C.; Naser, J.

    1997-03-01

    Application-specific integrated circuits (ASICs) were utilized in the design of nuclear plant safety systems because they have certain advantages over software-based systems and analog-based systems. An advantage they have over software-based systems is that an ASIC design can be simple enough to not include branch statements and also can be thoroughly tested. A circuit card on which an ASIC is mounted can be configured to replace various versions of older analog equipment with fewer design types required. The approach to design and testing of ASICs for safety system applications is discussed in this paper. Included are discussions of the ASIC architecture, how it is structured to assist testing, and of the functional and enhanced circuit testing.

  2. Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

    NASA Technical Reports Server (NTRS)

    Garber, A.; Godfroy, T.; Webster, K.

    2007-01-01

    Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  3. Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

    NASA Technical Reports Server (NTRS)

    Garber, A.; Godfroy, T.; Webster, K.

    2007-01-01

    Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

  4. Ramp generator circuit for probe diagnostics using microcontroller for LHCD system

    NASA Astrophysics Data System (ADS)

    Virani, C. G.; Sharma, P. K.; Lhcd Group

    2010-02-01

    It is well known that in LHCD system, the rf power coupling between antenna and plasma strongly depends on the edge plasma parameter. Thus it is mandatory to monitor edge plasma parameter to establish proper impedance matching condition when LHCD power is launched into the plasma. For SST1 LHCD system, we intend to monitor the edge plasma parameter employing electric probes, connected to the grill antenna sides for the said purpose. In SST1, initially LHCD system would couple rf power to plasmas lasting for small durations. Gradually the power and pulse length would be increased to eventually get 1000 seconds plasma. To monitor the edge plasma parameter, over such a wide spectrum (say few millisecond to seconds) during the above campaign, a flexible measurement scheme is desired which would cater to entire spectrum of operation. Normally a ramp is utilized to bias the electric probe, which yields various plasma parameters. To cater our requirement, the ramp generator must have facility to change ramp-up rate to meet our pulse length requirement. Further during SST operation, the human access near the machine would not be permitted and ramp circuit might not be accessible for manual settings. Thus remote setting facility to change ramp-up rate is also desired. Keeping these constraints in mind, a ramp circuit has been designed using Analog Device micro-controller ADuC842. The circuit has both manual and remote setting facility. Ramp generator parameters like Ramp-up rate, Trigger mode, number of cycles, etc. can be set from PC through RS-485 serial link. Initially low voltage (0-5V) ramp signal is generated using micro-controller and inbuilt DAC. This low voltage ramp is then amplified with PA-85 op-amp to get desired probe biasing voltage (-110V to +110V). The ramp period can be change form (1ms to 1000 ms) to cater to different plasma pulse length. Programming for micro-controller is done in structured language-C with the help of "Keil" IDE. In this paper, a

  5. 4H-SiC JFET Multilayer Integrated Circuit Technologies Tested Up to 1000 K

    NASA Technical Reports Server (NTRS)

    Spry, D. J.; Neudeck, P. G.; Chen, L.; Chang, C. W.; Lukco, D.; Beheim, G. M.

    2015-01-01

    Testing of semiconductor electronics at temperatures above their designed operating envelope is recognized as vital to qualification and lifetime prediction of circuits. This work describes the high temperature electrical testing of prototype 4H silicon carbide (SiC) junction field effect transistor (JFET) integrated circuits (ICs) technology implemented with multilayer interconnects; these ICs are intended for prolonged operation at temperatures up to 773K (500 C). A 50 mm diameter sapphire wafer was used in place of the standard NASA packaging for this experiment. Testing was carried out between 300K (27 C) and 1150K (877 C) with successful electrical operation of all devices observed up to 1000K (727 C).

  6. Life test of a nickel cadmium battery with a protection/reconditioning circuit

    NASA Technical Reports Server (NTRS)

    Lanier, J. R., Jr.; Bush, J. R., Jr.

    1981-01-01

    Results are discussed for a Ni-Cd battery test over a period of 8 years, 2 months and 44,213 simulated low Earth orbits. The battery cells were protected against overdischarge and reversal at discharge rates up to 25 amperes (1.25C) by a battery protection and reconditioning circuit. The circuit performed flawlessly during the test, and proved its value, both as a battery reconditioner and a cell protection device. Battery cell failures are also discussed. The test demonstrated the viability of using Ni-Cd batteries at depth-of-discharge up to 25 percent for over 5 years in a low Earth orbit.

  7. The thermoelectric generator test program at JPL.

    NASA Technical Reports Server (NTRS)

    Stapfer, G.; Rouklove, P.

    1972-01-01

    Discussion of the test results and analysis performed on data obtained from eight thermoelectric generators exhibiting a total combined operating time of about 21 years. Three (3) SNAP-19 type generators are discussed. Generator SN-20, the engineering model of the units presently operating on the Nimbus S/C, has been in operation for over 4 years and has shown drastic degradation after losing the internal cover gas. Generator SN-21, with more than four years of operating time, is operated in an air environment. The performance of this generator appears predictable and stable. For the last 2 years of operation generator degradation has been negligible. Generator SN-31, which utilizes the TAGS material for the P thermoelectric leg, is similar in design to the units to be used on the Pioneer S/C and has operated for over two years in an all-argon atmosphere.

  8. Integration of MHD load models with circuit representations the Z generator.

    SciTech Connect

    Jennings, Christopher A.; Ampleford, David J.; Jones, Brent Manley; McBride, Ryan D.; Bailey, James E.; Jones, Michael C.; Gomez, Matthew Robert.; Cuneo, Michael Edward; Nakhleh, Charles; Stygar, William A.; Savage, Mark Edward; Wagoner, Timothy C.; Moore, James K.

    2013-03-01

    MHD models of imploding loads fielded on the Z accelerator are typically driven by reduced or simplified circuit representations of the generator. The performance of many of the imploding loads is critically dependent on the current and power delivered to them, so may be strongly influenced by the generators response to their implosion. Current losses diagnosed in the transmission lines approaching the load are further known to limit the energy delivery, while exhibiting some load dependence. Through comparing the convolute performance of a wide variety of short pulse Z loads we parameterize a convolute loss resistance applicable between different experiments. We incorporate this, and other current loss terms into a transmission line representation of the Z vacuum section. We then apply this model to study the current delivery to a wide variety of wire array and MagLif style liner loads.

  9. Development of a Three-Tier Test to Assess Misconceptions about Simple Electric Circuits

    ERIC Educational Resources Information Center

    Pesman, Haki; Eryilmaz, Ali

    2010-01-01

    The authors aimed to propose a valid and reliable diagnostic instrument by developing a three-tier test on simple electric circuits. Based on findings from the interviews, open-ended questions, and the related literature, the test was developed and administered to 124 high school students. In addition to some qualitative techniques for…

  10. Development of a Three-Tier Test to Assess Misconceptions about Simple Electric Circuits

    ERIC Educational Resources Information Center

    Pesman, Haki; Eryilmaz, Ali

    2010-01-01

    The authors aimed to propose a valid and reliable diagnostic instrument by developing a three-tier test on simple electric circuits. Based on findings from the interviews, open-ended questions, and the related literature, the test was developed and administered to 124 high school students. In addition to some qualitative techniques for…

  11. Scalable Testing Platform for CMOS Read In Integrated Circuits

    DTIC Science & Technology

    2016-03-31

    necessary to operate the RIIC over a serial line with an Arduino microcontroller. The Arduino microcontroller then formats the control signals from...board (BRT). The BRT is a custom board that attaches to the Arduino and routes the signals to the correct pins on the test RIIC and delivers power...system and test that RIICs work in harmony with each other. Another feature of the MRTP is that it can communicate directly to the Arduino bypassing

  12. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 42 Public Health 1 2014-10-01 2014-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus will...

  13. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 42 Public Health 1 2013-10-01 2013-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus will...

  14. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 42 Public Health 1 2010-10-01 2010-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus will...

  15. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 42 Public Health 1 2011-10-01 2011-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus will...

  16. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 42 Public Health 1 2012-10-01 2012-10-01 false Test for carbon dioxide in inspired gas; open- and... carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open-circuit apparatus. (1) The concentration of carbon dioxide in inspired gas in open-circuit apparatus will...

  17. MYSID TWO-GENERATION TEST GUIDELINE

    EPA Science Inventory

    McKenney, Charles L., Jr. In press. Mysid Two-Generation Test Guideline. OECD Expert Group on Invertebrate Testing for Endocrine Disruptors, Organisation for Economic Co-operation and Development, Paris, France. 17 p. (ERL,GB 1215).

    This guideline describes a two-generati...

  18. MYSID TWO-GENERATION TEST GUIDELINE

    EPA Science Inventory

    McKenney, Charles L., Jr. In press. Mysid Two-Generation Test Guideline. OECD Expert Group on Invertebrate Testing for Endocrine Disruptors, Organisation for Economic Co-operation and Development, Paris, France. 17 p. (ERL,GB 1215).

    This guideline describes a two-generati...

  19. Formal methods for test case generation

    NASA Technical Reports Server (NTRS)

    Rushby, John (Inventor); De Moura, Leonardo Mendonga (Inventor); Hamon, Gregoire (Inventor)

    2011-01-01

    The invention relates to the use of model checkers to generate efficient test sets for hardware and software systems. The method provides for extending existing tests to reach new coverage targets; searching *to* some or all of the uncovered targets in parallel; searching in parallel *from* some or all of the states reached in previous tests; and slicing the model relative to the current set of coverage targets. The invention provides efficient test case generation and test set formation. Deep regions of the state space can be reached within allotted time and memory. The approach has been applied to use of the model checkers of SRI's SAL system and to model-based designs developed in Stateflow. Stateflow models achieving complete state and transition coverage in a single test case are reported.

  20. Generation of modules for control communication circuits: A design study used in the framework of the safe vehicle PROMETHEUS

    NASA Astrophysics Data System (ADS)

    Sabouni, Imad

    1992-01-01

    The implementation of communication protocols on silicon integrated circuits for access control is considered. The field of application is the European PROMETHEUS (Program for European Traffic with Highest Efficiency and Unprecedented Safety) project. The design of communication circuits for network access control is discussed. The control type local network and the related protocols are analyzed. Market available communication controllers are presented. The functions and the architecture of network control systems are described and the interfaces with the host system are considered. A method based on the generation of modules for communication circuit's design is proposed. Examples of circuits generated for vehicle application networks are given. The feasibility of obstacle detection distributed system is investigated.

  1. Closed Cycle Cryocooler for Low Temperature Electronics Circuits: Cold End Test.

    DTIC Science & Technology

    1983-08-01

    more isolated from the electrical load. -l A Stirling cryocooler is sensitive to the total amount of void volume associ- ated with the working gas...ID-Ai34 043 CLOSED CYCLE CRYOCOOLER FOR LOU TEMPERATURE ELECTRONICS i/i CIRCUITS: COLD END TEST(U) CT1-CRYOGENICS WALTHAM MA F N PIRTLE AUG 83...CRYOGENICS CLOSED CYCLE CRYOCOOLER FOR LOW TEMPERATURE ELECTRONICS CIRCUITS COLD END TEST CONTRACT N00014-82-C-0326 ’Ilk LAJ FELI d1XV10.601 nd cam u wt

  2. Survey results of low voltage circuit breakers as found during maintenance testing

    SciTech Connect

    O`Donnell, P.

    1995-12-31

    The Power systems Reliability Subcommittee strives to maintain current reliability data on major electrical equipment to assist the industry in accomplishing realistic and meaningful reliability studies. This paper presents results of a low voltage circuit breaker reliability survey achieved through use of available results from testing during preventive maintenance. A substantial number of test results were obtained to allow credible results for a few different circuit breaker categories. A similar set of results was published in a paper for the 1990 Industry Applications Society Conference. Most of these results have been incorporated into this new expanded effort.

  3. Development of a stereo-symmetrical nanosecond pulsed power generator composed of modularized avalanche transistor Marx circuits

    NASA Astrophysics Data System (ADS)

    Li, Jiang-Tao; Zhong, Xu; Cao, Hui; Zhao, Zheng; Xue, Jing; Li, Tao; Li, Zheng; Wang, Ya-Nan

    2015-09-01

    Avalanche transistors have been widely studied and used in nanosecond high voltage pulse generations. However, output power improvement is always limited by the low thermal capacities of avalanche transistors, especially under high repetitive working frequency. Parallel stacked transistors can effectively improve the output current but the controlling of trigger and output synchronism has always been a hard and complex work. In this paper, a novel stereo-symmetrical nanosecond pulsed power generator with high reliability was developed. By analyzing and testing the special performances of the combined Marx circuits, numbers of meaningful conclusions on the pulse amplitude, pulse back edge, and output impedance were drawn. The combining synchronism of the generator was confirmed excellent and lower conducting current through the transistors was realized. Experimental results showed that, on a 50 Ω resistive load, pulses with 1.5-5.2 kV amplitude and 5.3-14.0 ns width could be flexibly generated by adjusting the number of combined modules, the supply voltage, and the module type.

  4. Development of a stereo-symmetrical nanosecond pulsed power generator composed of modularized avalanche transistor Marx circuits.

    PubMed

    Li, Jiang-Tao; Zhong, Xu; Cao, Hui; Zhao, Zheng; Xue, Jing; Li, Tao; Li, Zheng; Wang, Ya-Nan

    2015-09-01

    Avalanche transistors have been widely studied and used in nanosecond high voltage pulse generations. However, output power improvement is always limited by the low thermal capacities of avalanche transistors, especially under high repetitive working frequency. Parallel stacked transistors can effectively improve the output current but the controlling of trigger and output synchronism has always been a hard and complex work. In this paper, a novel stereo-symmetrical nanosecond pulsed power generator with high reliability was developed. By analyzing and testing the special performances of the combined Marx circuits, numbers of meaningful conclusions on the pulse amplitude, pulse back edge, and output impedance were drawn. The combining synchronism of the generator was confirmed excellent and lower conducting current through the transistors was realized. Experimental results showed that, on a 50 Ω resistive load, pulses with 1.5-5.2 kV amplitude and 5.3-14.0 ns width could be flexibly generated by adjusting the number of combined modules, the supply voltage, and the module type.

  5. Modal testing circuit board assembly of an electronic apparatus by laser vibrometry

    NASA Astrophysics Data System (ADS)

    Krasnoveikin, V. A.; Smolin, I. Yu; Druzhinin, N. V.; Kolubaev, E. A.; Derusova, D. A.

    2016-11-01

    The operating capacity and service life of printed circuit boards in various electronic equipment and devices depends on their ability to resist vibroacoustic loads, including vibration and acoustic noises. In this paper, non-contact laser vibrometry has been applied to perform the modal analysis of a circuit board assembly in order to identify its vulnerable spots and to find solutions to protect the assembly from external vibroacoustic loads. A broadband periodic chirp signal was used to excite vibration, which enabled a rapid generation of results. The paper provides data on eigenfrequencies, vibration velocity fields, and vibration displacement profiles. Frequency ranges have been determined in which eigenfrequencies with the highest vibration amplification lie. The obtained data can be used to develop a quality control technique for printed circuit boards and to optimize their construction as early as the design stage.

  6. Searching and generating test inputs for mutation testing.

    PubMed

    Papadakis, Mike; Malevris, Nicos

    2013-12-01

    Mutation testing is usually regarded as an important method towards fault revealing. Despite this advantage, it has proved to be impractical for industrial use because of its expenses. To this extend, automated techniques are needed in order to apply and reduce the method's demands. Whilst there is much evidence that automated test data generation techniques can effectively automate the testing process, there has been little work on applying them in the context of mutation testing. In this paper, search-based testing is used in order to effectively generate test inputs capable of revealing mutants. To this end, a dynamic execution scheme capable of introducing and guiding the search towards the sought mutants is proposed. Experimentation with the proposed approach reveals its superiority from the previously proposed methods. Additionally, the framework's feasibility and practicality of producing mutation based test cases are also demonstrated.

  7. Non-zero basal oxygen flow a hazard to anesthesia breathing circuit leak test.

    PubMed

    Tokumine, Joho; Sugahara, Kazuhiro; Gushiken, Kouji; Ohta, Minoru; Matsuyama, Tomoaki; Saikawa, Satoko

    2005-04-01

    The non-zero basal flow (BF) of oxygen in anesthesia machines has been set to supply the basal metabolic requirement of oxygen. However, there is no scientific evidence of its necessity. In this study we sought to clarify whether non-zero BF affects leak detection during preanesthetic inspections. Twenty-five participants performed leak tests on anesthesia machines to detect breathing circuit leaks. Artificial leak-producing devices were used to create leaks from 0 to 1.0 L/min. The investigator randomly chose the leak device and connected it into the breathing circuit. Participants, blinded as to the presence or the type of leak producing device, then tested the breathing circuit for leaks. The conventional breathing system leak test was performed with and without BF. The results of leak detection in each leak procedure were analyzed statistically. The leak detection rate of leak test with BF was less than without BF (P < 0.01). We demonstrated that non-zero BF of oxygen decreases the leak detection rate and is an obstacle for leak detection, especially for small leaks. Therefore, we recommend that breathing circuit leak tests should be performed in the absence of BF of oxygen.

  8. Assessing the SEU resistance of CMOS latches using alpha-particle sensitive test circuits

    NASA Technical Reports Server (NTRS)

    Buehler, M.; Blaes, B.; Nixon, R.

    1990-01-01

    The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environment is evident in the upset rate of the Tracking and Data Relay Satellite (TDRS) launched in Apr. 1983. This satellite experiences a single-event-upset (SEU) per day which must be corrected from the ground. Such experience caused a redesign of the Galileo spacecraft with SEU resistant IC's. The solution to the SEU problem continues to be important as the complexity of spacecraft grows, the feature size of IC's decreases, and as space systems are designed with circuits fabricated at non-radiation hardened foundries. This paper describes an approach for verifying the susceptibility of CMOS latches to heavy-ion induced state changes. The approach utilizes alpha particles to induce the upsets in test circuits. These test circuits are standard cells that have offset voltages which sensitize the circuits to upsets. These results are then used to calculate the upsetability at operating voltages. In this study results are presented for the alpha particle upset of a six-transistor static random access memory (SRAM) cell. Then a methodology is described for the analysis of a standard-cell inverter latch.

  9. Testing of Diode-Clamping in an Inductive Pulsed Plasma Thruster Circuit

    NASA Technical Reports Server (NTRS)

    Toftul, Alexandra; Polzin, Kurt A.; Martin, Adam K.; Hudgins, Jerry L.

    2014-01-01

    Testing of a 5.5 kV silicon (Si) diode and 5.8 kV prototype silicon carbide (SiC) diode in an inductive pulsed plasma thruster (IPPT) circuit was performed to obtain a comparison of the resulting circuit recapture efficiency,eta(sub r), defined as the percentage of the initial charge energy remaining on the capacitor bank after the diode interrupts the current. The diode was placed in a pulsed circuit in series with a silicon controlled rectifier (SCR) switch, and the voltages across different components and current waveforms were collected over a range of capacitor charge voltages. Reverse recovery parameters, including turn-off time and peak reverse recovery current, were measured and capacitor voltage waveforms were used to determine the recapture efficiency for each case. The Si fast recovery diode in the circuit was shown to yield a recapture efficiency of up to 20% for the conditions tested, while the SiC diode further increased recapture efficiency to nearly 30%. The data presented show that fast recovery diodes operate on a timescale that permits them to clamp the discharge quickly after the first half cycle, supporting the idea that diode-clamping in IPPT circuit reduces energy dissipation that occurs after the first half cycle

  10. Microbiota-generated metabolites promote metabolic benefits via gut-brain neural circuits.

    PubMed

    De Vadder, Filipe; Kovatcheva-Datchary, Petia; Goncalves, Daisy; Vinera, Jennifer; Zitoun, Carine; Duchampt, Adeline; Bäckhed, Fredrik; Mithieux, Gilles

    2014-01-16

    Soluble dietary fibers promote metabolic benefits on body weight and glucose control, but underlying mechanisms are poorly understood. Recent evidence indicates that intestinal gluconeogenesis (IGN) has beneficial effects on glucose and energy homeostasis. Here, we show that the short-chain fatty acids (SCFAs) propionate and butyrate, which are generated by fermentation of soluble fiber by the gut microbiota, activate IGN via complementary mechanisms. Butyrate activates IGN gene expression through a cAMP-dependent mechanism, while propionate, itself a substrate of IGN, activates IGN gene expression via a gut-brain neural circuit involving the fatty acid receptor FFAR3. The metabolic benefits on body weight and glucose control induced by SCFAs or dietary fiber in normal mice are absent in mice deficient for IGN, despite similar modifications in gut microbiota composition. Thus, the regulation of IGN is necessary for the metabolic benefits associated with SCFAs and soluble fiber.

  11. Controllable high-fidelity quantum state transfer and entanglement generation in circuit QED

    PubMed Central

    Xu, Peng; Yang, Xu-Chen; Mei, Feng; Xue, Zheng-Yuan

    2016-01-01

    We propose a scheme to realize controllable quantum state transfer and entanglement generation among transmon qubits in the typical circuit QED setup based on adiabatic passage. Through designing the time-dependent driven pulses applied on the transmon qubits, we find that fast quantum sate transfer can be achieved between arbitrary two qubits and quantum entanglement among the qubits also can also be engineered. Furthermore, we numerically analyzed the influence of the decoherence on our scheme with the current experimental accessible systematical parameters. The result shows that our scheme is very robust against both the cavity decay and qubit relaxation, the fidelities of the state transfer and entanglement preparation process could be very high. In addition, our scheme is also shown to be insensitive to the inhomogeneous of qubit-resonator coupling strengths. PMID:26804326

  12. Controllable high-fidelity quantum state transfer and entanglement generation in circuit QED.

    PubMed

    Xu, Peng; Yang, Xu-Chen; Mei, Feng; Xue, Zheng-Yuan

    2016-01-25

    We propose a scheme to realize controllable quantum state transfer and entanglement generation among transmon qubits in the typical circuit QED setup based on adiabatic passage. Through designing the time-dependent driven pulses applied on the transmon qubits, we find that fast quantum sate transfer can be achieved between arbitrary two qubits and quantum entanglement among the qubits also can also be engineered. Furthermore, we numerically analyzed the influence of the decoherence on our scheme with the current experimental accessible systematical parameters. The result shows that our scheme is very robust against both the cavity decay and qubit relaxation, the fidelities of the state transfer and entanglement preparation process could be very high. In addition, our scheme is also shown to be insensitive to the inhomogeneous of qubit-resonator coupling strengths.

  13. Thermal verification testing of commercial printed-circuit boards for spaceflight

    NASA Technical Reports Server (NTRS)

    Foster, William M., II

    1991-01-01

    A method is discussed developed to verify commercial printed-circuit boards for a shuttle orbital flight. The Space Acceleration Measurement System Project used this method first with great success. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Then temperature definition tests are performed that consist of infrared scanning, thermal vacuum testing, and preliminary thermal operational testing. Only the engineering unit is used for temperature definition testing, but the preliminary thermal operational testing is performed on the flight unit after the temperature range has been defined. In the sequence of testing, vibration testing is performed next, but most vibration failures cannot be detected without subsequent temperature cycling. Finally, final assembly testing is performed to simulate the shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 hours of trouble-free operation. Verification is successful when all components and final assemblies have passed each test satisfactory. This method was very successful in verifying that commercial printed-circuit boards will survive in the shuttle environment.

  14. Computational Model of Recurrent Subthalamo-Pallidal Circuit for Generation of Parkinsonian Oscillations

    PubMed Central

    Shouno, Osamu; Tachibana, Yoshihisa; Nambu, Atsushi; Doya, Kenji

    2017-01-01

    Parkinson's disease is a movement disorder caused by dopamine depletion in the basal ganglia. Abnormally synchronized neuronal oscillations between 8 and 15 Hz in the basal ganglia are implicated in motor symptoms of Parkinson's disease. However, how these abnormal oscillations are generated and maintained in the dopamine-depleted state is unknown. Based on neural recordings in a primate model of Parkinson's disease and other experimental and computational evidence, we hypothesized that the recurrent circuit between the subthalamic nucleus (STN) and the external segment of the globus pallidus (GPe) generates and maintains parkinsonian oscillations, and that the cortical excitatory input to the STN amplifies them. To investigate this hypothesis through computer simulations, we developed a spiking neuron model of the STN-GPe circuit by incorporating electrophysiological properties of neurons and synapses. A systematic parameter search by computer simulation identified regions in the space of the intrinsic excitability of GPe neurons and synaptic strength from the GPe to the STN that reproduce normal and parkinsonian states. In the parkinsonian state, reduced firing of GPe neurons and increased GPe-STN inhibition trigger burst activities of STN neurons with strong post-inhibitory rebound excitation, which is usually subject to short-term depression. STN neuronal bursts are shaped into the 8–15 Hz, synchronous oscillations via recurrent interactions of STN and GPe neurons. Furthermore, we show that cortical excitatory input to the STN can amplify or suppress pathological STN oscillations depending on their phase and strength, predicting conditions of cortical inputs to the STN for suppressing oscillations. PMID:28377699

  15. Built-In Test from the chip up - Self-testing integrated circuit design methodologies

    NASA Astrophysics Data System (ADS)

    Ferrell, John

    1988-09-01

    Design techniques for implementing BIT on the integrated circuit level are described, along with the voting circuitry and BIT functions. It is pointed out that the application of BITE on a chip level offers the potential of significantly reducing repair time, increasing maintainability, and increasing system reliability. BIT on IC substrates can be easily implemented using component redundant circuits and an appropriate voting circuit. A simple binary comparator can be used to compare outputs from digital logic circuits, and a window comparator can be used to compare analog paths. It is suggested that the application of nonvolatile memory and system status communication circuitry can extend the usefulness of the reconfigurable analog fault-tolerant IC architecture.

  16. Design of parity generator and checker circuit using electro-optic effect of Mach-Zehnder interferometers

    NASA Astrophysics Data System (ADS)

    Kumar, Santosh; Chanderkanta; Amphawan, Angela

    2016-04-01

    Parity is an extra bit which is used to add in digital information to detect error at the receiver end. It can be even and odd parity. In case of even parity, the number of one's will be even included the parity and reverse in the case of odd parity. The circuit which is used to generate the parity at the transmitter side, called the parity generator and the circuit which is used to detect the parity at receiver side is called as parity checker. In this paper, an even and odd parity generator and checker circuits are designed using electro-optic effect inside lithium niobate based Mach-Zehnder Interferometers (MZIs). The MZIs structures collectively show powerful capability in switching an input optical signal to a desired output port from a collection of output ports. The paper constitutes a mathematical description of the proposed device and thereafter simulation using MATLAB. The study is verified using beam propagation method (BPM).

  17. Short circuit testing of a nickel-hydrogen cell for compliance with range safety requirements

    SciTech Connect

    Tracinski, W.A.; Applewhite, A.Z.

    1997-12-01

    Short circuit testing was performed on a single stack, Independent Pressure Vessel (IPV) aerospace Nickel-Hydrogen cell with axial terminals for compliance with range safety requirements. The cell contained two brazed ceramic seals, was 3 1/2 inches in diameter, and had a nameplate rating of 85.5 Ah. The majority of the energy was released in the first ten minutes with peak terminal temperature reaching 192 degrees Celsius. No breaching of the cell was evident and the cell returned to normal open circuit voltage within fifteen minutes of the load being removed.

  18. Next Generation Drivetrain Development and Test Program

    SciTech Connect

    Keller, Jonathan; Erdman, Bill; Blodgett, Doug; Halse, Chris; Grider, Dave

    2015-11-03

    This presentation was given at the Wind Energy IQ conference in Bremen, Germany, November 30 through December 2, 2105. It focused on the next-generation drivetrain architecture and drivetrain technology development and testing (including gearbox and inverter software and medium-voltage inverter modules.

  19. Computer-Based Arithmetic Test Generation

    ERIC Educational Resources Information Center

    Trocchi, Robert F.

    1973-01-01

    The computer can be a welcome partner in the instructional process, but only if there is man-machine interaction. Man should not compromise system design because of available hardware; the computer must fit the system design for the result to represent an acceptable solution to instructional technology. The Arithmetic Test Generator system fits…

  20. Temperature distortion generator for turboshaft engine testing

    NASA Technical Reports Server (NTRS)

    Klann, G. A.; Barth, R. L.; Biesiadny, T. J.

    1984-01-01

    The procedures and unique hardware used to conduct an experimental investigation into the response of a small-turboshaft-engine compression system to various hot gas ingestion patterns are presented. The temperature distortion generator described herein uses gaseous hydrogen to create both steady-state and time-variant, or transient, temperature distortion at the engine inlet. The range of transient temperature ramps produced by the distortion generator during the engine tests was from less than 111 deg K/sec (200 deg R/sec) to above 611 deg K/sec (1100 deg R/sec); instantaneous temperatures to 422 deg K (760 deg R) above ambient were generated. The distortion generator was used to document the maximum inlet temperatures and temperature rise rates that the compression system could tolerate before the onset of stall for various circumferential distortions as well as the compressor system response during stall.

  1. Improved methodology for generating controlled test atmospheres.

    PubMed

    Miller, R R; Letts, R L; Potts, W J; McKenna, M J

    1980-11-01

    Improved methodology has been developed for generating controlled test atmospheres. Vaporization of volatile liquids is accomplished in a 28 mm (O.D.) glass J-tube in conjunction with a compressed air flameless heat torch, a pressure-sensitive switch, and a positive displacement piston pump. The vaporization system has been very reliable with a variety of test materials in studies ranging from a few days to several months. The J-tube vaporization assembly minimizes the possibility of thermal decomposition of the test material and affords a better margin of safety when vaporizing potentially explosive materials.

  2. Molten-Caustic-Leaching (Gravimelt) System Integration Project, Phase 2. Topical report for test circuit operation

    SciTech Connect

    Not Available

    1993-02-01

    The objective of the task (Task 6) covered in this document was to operate the refurbished/modified test circuit of the Gravimeh Process in a continuous integrated manner to obtain the engineering and operational data necessary to assess the technical performance and reliability of the circuit. This data is critical to the development of this technology as a feasible means of producing premium clean burning fuels that meet New Source Performance Standards (NSPS). Significant refurbishments and design modifications had been made to the facility (in particular to the vacuum filtration and evaporation units) during Tasks 1 and 2, followed by off-line testing (Task 3). Two weeks of continuous around-the-clock operation of the refurbished/modified MCL test circuit were performed. During the second week of testing, all sections of the plant were operated in an integrated fashion for an extended period of time, including a substantial number of hours of on-stream time for the vacuum filters and the caustic evaporation unit. A new process configuration was tested in which centrate from the acid wash train (without acid addition) was used as the water makeup for the water wash train, thus-eliminating the one remaining process waste water stream. A 9-inch centrifuge was tested at various solids loadings and at flow rates up to 400 lbs/hr of coal feed to obtain a twenty-fold scaleup factor over the MCL integrated test facility centrifuge performance data.

  3. Modifications and Modeling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. Data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  4. Recent Updates to the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIP, provided by Idaho National Laboratory (1NL), is the subject of the first round of experimentation. This presentation details the physical changes made to the FSP-PTC and the current test program.

  5. Modifications and Modeling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

    NASA Technical Reports Server (NTRS)

    Garber, Anne E.

    2008-01-01

    An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. Data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

  6. Tests show ability of vacuum circuit breaker to interrupt fast transient recovery voltage rates of rise of transformer secondary faults

    SciTech Connect

    Smith, R.K.

    1994-12-31

    A Vacuum Circuit Breaker demonstrated its ability to interrupt short circuits with faster than normal rates of rise of Transient Recovery Voltage (TRV) at levels greater than those produced by most transformer secondary faults. Two recent exploratory test programs evaluated the interrupting ability of a 15kV Vacuum Circuit Breaker containing interrupters of the rotating arc type with contacts made from a Chromium-Copper powder metal mixture. The interrupting conditions covered a wide range of currents from 10% to 130% of the 28kA rated short circuit current of the tested circuit breaker and a wide range of TRV rates of rise, including the relatively slow rate of rise, normally used in testing and found in most indoor circuit breaker applications; two faster rates of rise equaling and exceeding those found in a known power plant transformer secondary protection application; and the fastest rates of rise possible in the laboratory which exceed the requirements of most transformer secondary faults. These tests showed that the interrupting performance of the tested Vacuum Circuit Breaker was unaffected by the TRV rate of rise to the fastest rates available in the test lab. Such a Vacuum Circuit Breaker can therefore be used without TRV modifying capacitors to slow down the rate of rise provided by the power system. This ability is particularly important if analysis shows that the expected TRV from a transformer secondary fault has a fast rate of rise beyond the recognized ability of an older circuit breaker to acceptably interrupt.

  7. Tests show ability of vacuum circuit breaker to interrupt fast transient recovery voltage rates of rise of transformer secondary faults

    SciTech Connect

    Smith, R.K.

    1995-01-01

    A vacuum circuit breaker demonstrated its ability to interrupt short circuits with faster than normal rates of rise of transient recovery voltage (TRV) at levels greater than those produced by most transformer secondary faults. Two recent exploratory test programs evaluated the interrupting ability of a 15kV vacuum circuit breaker containing interrupters of the rotating arc type with contacts made from a chromium-copper powder metal mixture. The interrupting conditions covered a wide range of currents from 10% to 130% of the 28kA rated short circuit current of the tested circuit breaker and a wide range of TRV rates of rise, including the relatively slow rate of rise, normally used in testing and found in most indoor circuit breaker applications, two faster rates of rise equaling and exceeding those found in a known power plant transformer secondary protection application, and the fastest rates of rise possible in the laboratory which exceed the requirements of most transformer secondary faults. These tests showed that the interrupting performance of the tested vacuum circuit breaker was unaffected by the TRV rate of rise to the fastest rates available in the test lab. Such a vacuum circuit breaker can therefore be used without TRV modifying capacitors to slow down the rate of rise provided by the power system. This ability is particularly important if analysis shows that the expected TRV from a transformer secondary fault has a fast rate of rise beyond the recognized ability of an older circuit breaker to acceptably interrupt.

  8. Very high speed integrated circuits - Into the second generation. I - The birth of a program

    NASA Astrophysics Data System (ADS)

    Martin, J.

    1981-12-01

    A development program for very high speed integrated circuits (VHSIC) for DOD applications is discussed. The advent of Soviet 16K RAM chips two years after the U.S. led to a three phase U.S. program to define VHSIC configurations, architecture, and testing, and provide pilot production of radiation-hardened chips. Another phase will lead to submicron ICs with a gate-clock frequency product of more than 10 billion gate-Hz/sq cm, with a minimum chip clock rate of 100 MHz. A further phase involves research support to universities. Electron beam lithography receives the greatest efforts, having alignment accuracies of 0.5 micron. Congressional discussions for funding are reviewed, noting the cancellation of GaAs research to avoid conflicts with DARPA research, and attention is paid to the effects of a centralized research program responsive to the DOD, instead of separate programs for each service branch.

  9. Fabrication and test of nano crossbar switches/MOSFET hybrid circuits by imprinting lithography

    NASA Astrophysics Data System (ADS)

    Li, Zhiyong; Li, Xuema; Ohlberg, Douglas A. A.; Straznicky, Joseph; Wu, Wei; Yu, Zhaoning; Borghetti, Julien; Tong, William; Stewart, Duncan; Williams, R. Stanley

    2008-03-01

    An integrated circuit combining imprinted, nanoscale crossbar switches with metal-oxide field effect transistors (MOSFET) was fabricated and tested. Construction of the circuits began with fabrication of n-channel MOSFET devices on silicon-on-insulator (SOI) substrates using CMOS compatible process techniques. To protect the FET devices as well as provide a flat surface for subsequent nanoimprint lithography, passivation and planarization layers were deposited. Crossbar junctions were then fabricated next to the FETs using imprint lithography to first define arrays of parallel nanowires over which, a switchable material layer was deposited. This was followed by a second imprint proces to construct another set of parallel wires on top of, and orthogonal to the first, to complete the nano-crossbar array with a half pitch (hp) of 50 nm. The switchable crossbar devices were then connected to the gate of the FETs and the resulting integrated circuit was tested using the FET as the output signal follower. This successful fabrication process serves as a proof-of-principle demonstration and a platform for advanced CMOS/nanoscale crossbar hybrid logic circuits.

  10. ADDER CIRCUIT

    DOEpatents

    Jacobsohn, D.H.; Merrill, L.C.

    1959-01-20

    An improved parallel addition unit is described which is especially adapted for use in electronic digital computers and characterized by propagation of the carry signal through each of a plurality of denominationally ordered stages within a minimum time interval. In its broadest aspects, the invention incorporates a fast multistage parallel digital adder including a plurality of adder circuits, carry-propagation circuit means in all but the most significant digit stage, means for conditioning each carry-propagation circuit during the time period in which information is placed into the adder circuits, and means coupling carry-generation portions of thc adder circuit to the carry propagating means.

  11. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

  12. Test structures for propagation delay measurements on high-speed integrated circuits

    NASA Technical Reports Server (NTRS)

    Long, S. I.

    1984-01-01

    The accuracy of high-speed wafer-level measurements on digital IC's is limited by the probe interface. This limitation strongly encourages the use of built-in on-chip test hardware to reduce the number of critical off-chip high-speed interfaces. A novel synchronous propagation delay test structure is described which will provide accurate parametric data under typical automatic test conditions. Built-in test features added to complex combinational circuits are shown which are useful for delay measurement and which reduce the total number of high-speed I/O connections while still providing acceptable fault coverage in many cases.

  13. Testing of the front-end hybrid circuits for the CMS Tracker upgrade

    NASA Astrophysics Data System (ADS)

    Gadek, T.; Blanchot, G.; Honma, A.; Kovacs, M.; Raymond, M.; Rose, P.

    2017-01-01

    The upgrade of the CMS Tracker for the HL-LHC requires the design of new double-sensor, silicon detector modules, which implement Level 1 trigger functionality in the increased luminosity environment. These new modules will contain two different, high-density front-end hybrid circuits, equipped with flip-chip ASICs, auxiliary electronic components and mechanical structures. The hybrids require qualification tests before they are assembled into modules. Test methods are proposed together with the corresponding test hardware and software. They include functional tests and signal injection in a cold environment to find possible failure modes of the hybrids under real operating conditions.

  14. WindoWorks: A flexible program for computerized testing of accelerator control system electronic circuit boards

    SciTech Connect

    Utterback, J.

    1993-09-01

    Since most accelerator control system circuit boards reside in a commercial bus architecture, such as CAMAC or VMEbus, a computerized test station is needed for exercising the boards. This test station is needed for the development of newly designed prototypes, for commissioning newly manufactured boards, for diagnosing boards which have failed in service, and for long term testing of boards with intermittent failure problems. WindoWorks was created to address these needs. It is a flexible program which runs on a PC compatible computer and uses a PC to bus crate interface. WindoWorks was designed to give the user a flexible way to test circuit boards. Each test is incapsulated into a window. By bringing up several different windows the user can run several different tests simultaneously. The windows are sizable, and moveable. They have data entry boxes so that the test can be customized to the users preference. The windows can be used in conjunction with each other in order to create supertests. There are several windows which are generic. They can be used to test basic functions on any VME (or CAMAC) board. There are other windows which have been created to test specific boards. New windows for testing specific boards can be easily created by a Pascal programmer using the WindoWorks framework.

  15. A combined noise analysis and power supply current based testing of CMOS analog integrated circuits

    NASA Astrophysics Data System (ADS)

    Srivastava, Ashok; Pulendra, Vani K.; Yellampalli, Siva

    2005-05-01

    A technique integrating the noise analysis based testing and the conventional power supply current testing of CMOS analog integrated circuits is presented for bridging type faults due to manufacturing defects. The circuit under test (CUT) is a CMOS amplifier designed for operation at +/- 2.5 V and implemented in 1.5 μm CMOS process. The faults simulating possible manufacturing defects have been introduced using the fault injection transistors. The amplifier circuit is analyzed and simulated in SPICE for its performance with and without fault injections. The faults in the CUT are identified by observing the variation in the equivalent noise voltage at the output of CUT. In power supply current testing, the current (IPS) through the power supply voltage, VDD is measured under the application of an AC input stimulus. The effect of parametric variation is taken into consideration by determining the tolerance limit using the Monte-Carlo analysis. The fault is identified if the power supply current, IPS lies outside the deviation given by Monte-Carlo analysis. Simulation results are in close agreement with the corresponding experimental values.

  16. Surface Degradation of Ag/W Circuit Breaker Contacts During Standardized UL Testing

    NASA Astrophysics Data System (ADS)

    Yu, Haibo; Sun, Yu; Kesim, M. Tumerkan; Harmon, Jason; Potter, Jonathan; Alpay, S. Pamir; Aindow, Mark

    2015-09-01

    The near-surface microstructure of Ag/W contacts from 120 V, 30 A commercial circuit breakers in the as-manufactured condition and after standardized UL overload/temperature-rise, endurance, and short-circuit testing have been investigated using a combination of x-ray diffraction, scanning electron microscopy, energy-dispersive x-ray spectroscopy, focused ion beam milling, and transmission electron microscopy. The as-manufactured contacts comprised three constituents: sintered Ag/W composite particles with fine-grained Ag and coarse-grained W, coarse-grained pockets of Ag infiltrate, and a nano-crystalline surface Ag layer. There are also WO3 and Ag2O phases at the surface. After UL overload/temperature-rise testing, there is Ag loss giving a porous W-rich layer at the contact surface. In addition to binary oxides, we observe the formation of Ag2WO4. After UL endurance testing, material is swept across the surface by the breaker action giving a W-rich eroded porous surface on one side and a build-up of mixed oxides on the other. After UL short-circuit testing, a W crust forms due to melting and re-solidification of W and vaporization of Ag, and mid-plane cracks form due to the severe thermal gradients. There is a strong correlation between the observed microstructural features and the contact resistance measurements obtained from these samples.

  17. A computer test bench for checking and adjusting the automatic regulators of generator excitation systems

    SciTech Connect

    Dovganyuk, I. Ya.; Labunets, I. A.; Plotnikova, T. V.; Sokur, P. V.

    2008-05-15

    A computer test bench for testing and debugging natural samples of the automatic excitation regulation systems of generators, the protection units and the power part of the excitation system is described. The bench includes a personal computer with specialized input-output circuit boards for analog and digital signals, and enables the time and cost involved in developing and checking control systems to be reduced considerably. The program employed operates in real time and enables the automatic excitation regulators of synchronous generators and generators with longitudinal-transverse excitation in a specific power system to be adjusted.

  18. Exploitation of parallelism and ultraspeed integrated circuits in the next generation of distributed super signal processors

    SciTech Connect

    Gilbert, B.K.; Naused, B.A.; Hartley, S.M.; Vannurden, W.K.; Deming, R.

    1983-10-01

    The emerging application of gallium arsenide digital integrated circuits to signal processing problems will require the development of architectures tuned to its special characteristics. Chip design methods may be similar to those used for silicon very high-speed integrated circuit (VHSIC) components, but system design constraints will be unique to GAAS. 8 references.

  19. Fault diagnosis of nonlinear analog circuits, volume 5. HAFDIC: A program for generating a hard fault dictionary

    NASA Astrophysics Data System (ADS)

    Elcherif, Y. S.; Lin, P. M.

    1983-04-01

    This volume contains the user's guide and the listing of HAFDIC, a program for generating hard fault dictionary for nonlinear analog circuits. The theoretical foundation for this program was described in two previous volumes of the report entitled Fault Diagnosis of Nonlinear Analog Circuits: Vol. 1. DC Diagnosis of Hard Failures, P.M. Lin and Y.S. Elcherif, July 1982 and Vol. 4 An Isolation Algorithm for the Analog Fault Dictionary, Y.S. Elcherif and P.M. Lin, April 1983.

  20. Dual stator winding variable speed asynchronous generator: magnetic equivalent circuit with saturation, FEM analysis and experiments

    NASA Astrophysics Data System (ADS)

    Tutelea, L. N.; Muntean, N.; Deaconu, S. I.; Cunţan, C. D.

    2016-02-01

    The authors carried out a theoretical and experimental study of dual stator winding squirrel cage asynchronous generator (DSWA) behaviour in the presence of saturation regime (non-sinusoidal) due to the variable speed operation. The main aims are the determination of the relations of calculating the equivalent parameters of the machine windings, FEM validation of parameters and characteristics with free FEMM 4.2 computing software and the practice experimental tests for verifying them. Issue is limited to three phase range of double stator winding cage-asynchronous generator of small sized powers, the most currently used in the small adjustable speed wind or hydro power plants. The tests were carried out using three-phase asynchronous generator having rated power of 6 [kVA].

  1. Flashing light signaling circuit in sponges: endogenous light generation after tissue ablation in Suberites domuncula.

    PubMed

    Wiens, Matthias; Wang, Xiaohong; Unger, Andreas; Schröder, Heinz C; Grebenjuk, Vladislav A; Pisignano, Dario; Jochum, Klaus P; Müller, Werner E G

    2010-12-15

    The skeleton of siliceous sponges (phylum Porifera: classes Demospongiae and Hexactinellida), composed of tightly interacting spicules that assemble to a genetically fixed scaffold, is formed of bio-silica. This inorganic framework with the quality of quartz glass has been shown to operate as light waveguide in vitro and very likely has a similar function in vivo. Furthermore, the molecular toolkit for endogenous light generation (luciferase) and light/photon harvesting (cryptochrome) has been identified in the demosponge Suberites domuncula. These three components of a light signaling system, spicules-luciferase-cryptochrome, are concentrated in the surface layers (cortex) of the poriferan body. Specimens from which this cortex has been removed/ablated do not emit light. However, with regeneration and reconstitution of the cortex the animals re-gain the capacity to flash light. This newly discovered characteristic of sponges to generate light prompted us to investigate the genetic basis for the endogenous light signaling system. As a potential transcription factor involved in the expression of luciferase and cryptochrome, a SOX-related protein has been identified. In dark-adapted animals or in tissue from below the cortex region, the medulla, no gene or protein expression of SOX-related protein, luciferase, and cryptochrome could be detected. However, during the regeneration of the cortex, a stage-specific expression pattern was recorded: SOX-related protein > luciferase > cryptochrome. We conclude that a flashing light signaling circuit exists, which might control the retinoic acid-induced differentiation of stem cells into pulsating and contracting sponge cells, that is, pinacocytes and myocytes.

  2. Reconfigurable Special Test Circuit of physics-based IGBT models parameter extraction

    NASA Astrophysics Data System (ADS)

    Rodríguez, Marco A.; Claudio, Abraham; Cotorogea, Maria; González, Leobardo H.; Aguayo, Jesús

    2010-11-01

    Physics-based models of power electronic devices are the most accurate for circuit simulation purposes. However, many parameters of such models are related to device physics and structure and are not directly available for the user. The IGBT is still the most used power semiconductor device for applications at medium power and frequency ranges, due to its good compromise between on-state loss, switching loss, and ease of control. This paper presents a procedure for extracting the most important parameters of the IGBT, with physical background and electrical measurements. The goal is to develop a deeply understanding of the device-structure and to simulate correctly both steady-state and transient period with any circuit simulation software without the IGBT model provided by the manufacturer. The method consists of seven test setups and seven algorithms for extracting 13 physical and structural parameters needed in most physics-based IGBT models; by using only one Reconfigurable Special Test Circuit in order to achieve the different test setups conditions.

  3. Generation of copper rich metallic phases from waste printed circuit boards

    SciTech Connect

    Cayumil, R.; Khanna, R.; Ikram-Ul-Haq, M.; Rajarao, R.; Hill, A.; Sahajwalla, V.

    2014-10-15

    Highlights: • Recycling and material recovery from waste printed circuit boards is very complex. • Thermoset polymers, ceramics and metals are present simultaneously in waste PCBs. • Heat treatment of PCBs was carried out at 1150 °C under inert conditions. • Various metallic phases could be segregated out as copper based metallic droplets. • Carbon and ceramics residues can be further recycled in a range of applications. - Abstract: The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150 °C under argon gas flowing at 1 L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the

  4. Experimental Testing of a Van De Graaff Generator as an Electromagnetic Pulse Generator

    DTIC Science & Technology

    2016-07-01

    EXPERIMENTAL TESTING OF A VAN DE GRAAFF GENERATOR AS AN ELECTROMAGNETIC PULSE GENERATOR THESIS...protection in the United States AFIT-ENP-MS-16-S-075 EXPERIMENTAL TESTING OF A VAN DE GRAAFF GENERATOR AS AN ELECTROMAGNETIC PULSE GENERATOR...RELEASE; DISTRIBUTION UNLIMITED. AFIT-ENP-MS-16-S-075 EXPERIMENTAL TESTING OF A VAN DE GRAAFF GENERATOR AS AN ELECTROMAGNETIC PULSE GENERATOR

  5. A Hardware-Implementation-Friendly Pulse-Coupled Neural Network Algorithm for Analog Image-Feature-Generation Circuits

    NASA Astrophysics Data System (ADS)

    Chen, Jun; Shibata, Tadashi

    2007-04-01

    Pulse-coupled neural networks (PCNNs) are biologically inspired algorithms that have been shown to be highly effective for image feature generation. However, conventional PCNNs are software-oriented algorithms that are too complicated to implement as very-large-scale integration (VLSI) hardware. To employ PCNNs in image-feature-generation VLSIs, a hardware-implementation-friendly PCNN is proposed here. By introducing the concepts of exponentially decaying output and a one-branch dendritic tree, the new PCNN eliminates the large number of convolution operators and floating-point multipliers in conventional PCNNs without compromising its performance at image feature generation. As an analog VLSI implementation of the new PCNN, an image-feature-generation circuit is proposed. By employing floating-gate metal-oxide-semiconductor (MOS) technology, the circuit achieves a full voltage-mode implementation of the PCNN in a compact structure. Inheriting the merits of the PCNN, the circuit is capable of generating rotation-independent and translation-independent features for input patterns, which has been verified by SPICE simulation.

  6. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 49 Transportation 4 2013-10-01 2013-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance with...

  7. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance with...

  8. 49 CFR 229.114 - Steam generator inspections and tests.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Steam generator inspections and tests. 229.114... Generators § 229.114 Steam generator inspections and tests. (a) Periodic steam generator inspection. Except as provided in § 229.33, each steam generator shall be inspected and tested in accordance with...

  9. Circuit monitors powerline interruptions

    NASA Technical Reports Server (NTRS)

    Simmons, N. E.; Stricklen, J. O.

    1977-01-01

    Simple circuit when combined with pulse detector detects momentary interruptions of 400-cycle ac signal. Circuit has been used during shock and vibration testing of electronic hardware to determine if tests caused interruptions of normal circuit operation.

  10. Circuit monitors powerline interruptions

    NASA Technical Reports Server (NTRS)

    Simmons, N. E.; Stricklen, J. O.

    1977-01-01

    Simple circuit when combined with pulse detector detects momentary interruptions of 400-cycle ac signal. Circuit has been used during shock and vibration testing of electronic hardware to determine if tests caused interruptions of normal circuit operation.

  11. BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability. Ph.D. Thesis

    NASA Technical Reports Server (NTRS)

    Chen, Chung-Hsing

    1992-01-01

    In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

  12. Analysis and Simulation on the Effect of Rotor Interturn Short Circuit on Magnetic Flux Density of Turbo-Generator

    NASA Astrophysics Data System (ADS)

    He, Yu-Ling; Ke, Meng-Qiang; Tang, Gui-Ji; Jiang, Hong-Chun; Yuan, Xing-Hua

    2016-09-01

    The intent of this paper is to investigate the effect of the interturn short circuit fault (ISCF) in rotor on the magnetic flux density (MFD) of turbo-generator. Different from other studies, this work not only pays attention to the influence of the faulty degrees on the general magnetic field, but also investigates the effect of the short circuit positions on the harmonic components of MFD. The theoretical analysis and the digital simulation through the FEM software Ansoft are performed for a QSFN-600-2YHG turbo-generator. Several significant formulas and conclusions drawn from the analysis and the simulation results are obtained to indicate the relation between the harmonic amplitude of the MFD and the faulty degree (via nm, the number of the short circuit turns), and the relation between the MFD harmonic amplitude and the faulty position (via αr, the angle of the two slots in which the interturn short circuit occurs). Also, the developing tendency of the general magnetic field intensity, the distribution of the magnetic flux lines, and the peak-to-peak value of MFD are presented.

  13. Design and Operation of a Simple Circuit Useful as a Modulator to Generate Arbitrary Composite ASK and PSK Carriers.

    DTIC Science & Technology

    1982-06-01

    051 in the test circuit of Fig. 2.1 showed no discernable phase shift either in superimposed input/output sinusoid displays or in Lissajous patterns...Figure 2.3 is a dynamic display of a Lissajous pattern showing the output from a 4051 with seven inputs ;rounded and a 30 kHz signal applied to the

  14. Use of picosecond optical pulses and FET's integrated with printed circuit antennas to generate millimeter wave radiation

    NASA Astrophysics Data System (ADS)

    Ni, D. C.; Plant, D. V.; Fetterman, H. R.; Matloubian, M.

    1991-03-01

    Millimeter-wave radiation has been generated from FETs and high electron mobility transistors (HEMTs), integrated with printed circuit antennas and illuminated with picosecond optical pulses. Modulation of the millimeter waves was achieved by applying a swept RF signal to the transistor gate. Using this technique, tunable electrical sidebands were added to the optically generated carrier providing a method of transmitting information. The technique also provides increased resolution for use in spectroscopic applications. Heterodyne detection demonstrated that the system continuously generated tunable radiation, constrained by the high-gain antenna, from 45 to 75 GHz.

  15. Super NiCd Open-Circuit Storage and Low Earth Orbit (LEO) Life Test Evaluation

    NASA Technical Reports Server (NTRS)

    Baer, Jean Marie; Hwang, Warren C.; Ang, Valerie J.; Hayden, Jeff; Rao, Gopalakrishna; Day, John H. (Technical Monitor)

    2002-01-01

    This presentation discusses Air Force tests performed on super NiCd cells to measure their performance under conditions simulating Low Earth Orbit (LEO) conditions. Super NiCd cells offer potential advantages over existing NiCd cell designs including advanced cell design with improved separator material and electrode making processes, but handling and storage requires active charging. These tests conclude that the super NiCd cells support generic Air Force qualifications for conventional LEO missions (up to five years duration) and that handling and storage may not actually require active charging as previously assumed. Topics covered include: Test Plan, Initial Characterization Tests, Open-Circuit Storage Tests, and post storage capacities.

  16. Examining students' understanding of electrical circuits through multiple-choice testing and interviews

    NASA Astrophysics Data System (ADS)

    Engelhardt, Paula Vetter

    Research has shown that both high school and university students have misconceptions about direct current resistive electric circuits. At present, there are no standard diagnostic examinations in electric circuits. Such an instrument would be useful in determining what conceptual problems students have either before or after instruction. The information provided by the exam can be used by classroom instructors to evaluate their instructional methods and the progress and conceptual problems of their students. It can be used to evaluate curricular packages and/or other supplemental materials for their effectiveness in overcoming students' conceptual difficulties. Two versions of a diagnostic instrument known as Determining and Interpreting Resistive Electric circuits Concepts Tests (DIRECT) were developed, each consisting of 29 questions. DIRECT was administered to groups of high school and university students in the United States, Canada and Germany. The students had completed their study of electrostatics and direct current electric circuits prior to taking the exam. Individual interviews were conducted after the administration of version 1.0 to determine how students were interpreting the questions and to uncover their reasoning behind their selections. The analyses indicate that students, especially females, tend to hold multiple misconceptions, even after instruction. The idea that the battery is a constant source of current was used most often in answering the questions. Although students tend to use different misconceptions for each question presented, they do use misconceptions associated with the global objective of the question. Students' definitions of terms used on the exam and their misconceptions were examined. Students tended to confuse terms, especially current. They assigned the properties of current to voltage and/or resistance. One of the major findings from the study was that students were able to translate easily from a "realistic" representation

  17. Infrared Thermography as Applied to Thermal Testing of Power Systems Circuit Boards.

    NASA Astrophysics Data System (ADS)

    Miles, Jonathan James

    All operational electronic equipment dissipates some amount of energy in the form of infrared radiation. Faulty electronic components on a printed circuit board can be categorized as hard (functional) or soft (latent functional). Hard faults are those which are detected during a conventional manufacturing electronic test process. Soft failures, in contrast, are those which are undetectable through conventional testing, but which manifest themselves after a product has been placed into service. Such field defective modules ultimately result in operational failure and subsequently enter a manufacturer's costly repair process. While thermal imaging systems are being used increasingly in the electronic equipment industry as a product-testing tool, applications have primarily been limited to product design or repair processes, with minimal use in a volume manufacturing environment. Use of thermal imaging systems in such an environment has mostly been limited to low-volume products or random screening of high-volume products. Thermal measurements taken in a manufacturing environment are often taken manually, thus defeating their capability of rapid data acquisition and constraining their full potential in a high-volume manufacturing process. Integration of a thermal measurement system with automated testing equipment is essential for optimal use of expensive infrared measurement tools in a high-volume manufacturing environment. However, such a marriage presents problems with respect to both existing manufacturing test processes and infrared measurement techniques. Methods are presented in this dissertation to test automatically for latent faults, those which elude detection during conventional electronic testing, on printed circuit boards. These methods are intended for implementation in a volume manufacturing environment and involve the application of infrared imaging tools. Successful incorporation of infrared testing into existing test processes requires that: PASS

  18. Optimal Test Design with Rule-Based Item Generation

    ERIC Educational Resources Information Center

    Geerlings, Hanneke; van der Linden, Wim J.; Glas, Cees A. W.

    2013-01-01

    Optimal test-design methods are applied to rule-based item generation. Three different cases of automated test design are presented: (a) test assembly from a pool of pregenerated, calibrated items; (b) test generation on the fly from a pool of calibrated item families; and (c) test generation on the fly directly from calibrated features defining…

  19. Optimal Test Design with Rule-Based Item Generation

    ERIC Educational Resources Information Center

    Geerlings, Hanneke; van der Linden, Wim J.; Glas, Cees A. W.

    2013-01-01

    Optimal test-design methods are applied to rule-based item generation. Three different cases of automated test design are presented: (a) test assembly from a pool of pregenerated, calibrated items; (b) test generation on the fly from a pool of calibrated item families; and (c) test generation on the fly directly from calibrated features defining…

  20. Design and test of a capacitance detection circuit based on a transimpedance amplifier

    NASA Astrophysics Data System (ADS)

    Linfeng, Mu; Wendong, Zhang; Changde, He; Rui, Zhang; Jinlong, Song; Chenyang, Xue

    2015-07-01

    This paper presents a transimpedance amplifier (TIA) capacitance detection circuit aimed at detecting micro-capacitance, which is caused by ultrasonic stimulation applied to the capacitive micro-machined ultrasonic transducer (CMUT). In the capacitance interface, a TIA is adopted to amplify the received signal with a center frequency of 400 kHz, and finally detect ultrasound pressure. The circuit has a strong anti-stray property and this paper also studies the calculation of compensation capacity in detail. To ensure high resolution, noise analysis is conducted. After optimization, the detected minimum ultrasound pressure is 2.1 Pa, which is two orders of magnitude higher than the former. The test results showed that the circuit was sensitive to changes in ultrasound pressure and the distance between the CMUT and stumbling block, which also successfully demonstrates the functionality of the developed TIA of the analog-front-end receiver. Project supported by the National Natural Science Foundation of China (No. 61127008) and the Subsidized Program of the National High Technology Research and Development Program of China (No. 2011AA040404).

  1. Design and test of elementary digital circuits based on monolithic SOI JFET`s

    SciTech Connect

    Fourches, N.

    1998-02-01

    Quite recently, designing circuits for high-energy physics experiments has become of vital importance. Here, silicon on insulator (SOI) junction field effect transistor (JFET`s) are used to develop digital gates for cryogenic applications. Only one type of JFET is necessary to design an NOR gate using a basic inverter circuit and a level shifter. The JFET`s involved in these designs are available in a process radiation hard at room temperature and operate with improved characteristics at cryogenic temperatures (90 K, temperature of liquid Argon calorimeters for high-energy physics). Test circuits have been designed to evaluate their performance. The measured characteristics prove to be satisfactory compared to the simulated ones, although some improvements are still necessary. A propagation delay of 4.4 ns per gate for a power dissipation of {approx}3 mW per gate is obtained. With the present development of cryogenic front end preamplifiers for the readout of calorimeter signals, this study opens some prospects for integrating more mixed digital analog electronics such as pipelines within the detectors.

  2. Experimental Durability Testing of 4H SiC JFET Integrated Circuit Technology at 727 Degrees Centigrade

    NASA Technical Reports Server (NTRS)

    Spry, David J.; Neudeck, Philip G.; Chen, Liangyu; Chang, Carl W.; Lukco, Dorothy; Beheim, Glenn M.

    2016-01-01

    We have reported SiC integrated circuits (ICs) with two levels of metal interconnect that have demonstrated prolonged operation for thousands of hours at their intended peak ambient operational temperature of 500 degrees Centigrade. However, it is recognized that testing of semiconductor microelectronics at temperatures above their designed operating envelope is vital to qualification. Towards this end, we previously reported operation of a 4H-SiC JFET IC ring oscillator on an initial fast thermal ramp test through 727 degrees Centigrade. However, this thermal ramp was not ended until a peak temperature of 880 degrees Centigrade (well beyond failure) was attained. Further experiments are necessary to better understand failure mechanisms and upper temperature limit of this extreme-temperature capable 4H-SiC IC technology.Here we report on additional experimental testing of custom-packaged 4H-SiC JFET IC devices at temperatures above 500 degrees Centigrade. In one test, the temperature was ramped and then held at 727 degrees Centigrade, and the devices were periodically measured until electrical failure was observed. A 4H-SiC JFET on this chip electrically functioned with little change for around 25 hours at 727 degrees Centigrade before rapid increases in device resistance caused failure. In a second test, devices from our next generation 4H-SiC JFET ICs were ramped up and then held at 700 degrees Centigrade (which is below the maximum deposition temperature of the dielectrics). Three ring oscillators functioned for 8 hours at this temperature before degradation. In a third experiment, an alternative die attach of gold paste and package lid was used, and logic circuit operation was demonstrated for 143.5 hours at 700 degrees Centigrade.

  3. Experimental Durability Testing of 4H SiC JFET Integrated Circuit Technology at 727 °C

    NASA Astrophysics Data System (ADS)

    Spry, David; Neudeck, Phil; Chen, Liangyu; Chang, Carl; Lukco, Dorothy; Beheim, Glenn

    2016-05-01

    We have reported SiC integrated circuits (IC's) with two levels of metal interconnect that have demonstrated prolonged operation for thousands of hours at their intended peak ambient operational temperature of 500 °C [1, 2]. However, it is recognized that testing of semiconductor microelectronics at temperatures above their designed operating envelope is vital to qualification. Towards this end, we previously reported operation of a 4H-SiC JFET IC ring oscillator on an initial fast thermal ramp test through 727 °C [3]. However, this thermal ramp was not ended until a peak temperature of 880 °C (well beyond failure) was attained. Further experiments are necessary to better understand failure mechanisms and upper temperature limit of this extreme-temperature capable 4H-SiC IC technology. Here we report on additional experimental testing of custom-packaged 4H-SiC JFET IC devices at temperatures above 500 °C. In one test, the temperature was ramped and then held at 727 °C, and the devices were periodically measured until electrical failure was observed. A 4H-SiC JFET on this chip electrically functioned with little change for around 25 hours at 727 °C before rapid increases in device resistance caused failure. In a second test, devices from our next generation 4H-SiC JFET ICs were ramped up and then held at 700 °C (which is below the maximum deposition temperature of the dielectrics). Three ring oscillators functioned for 8 hours at this temperature before degradation. In a third experiment, an alternative die attach of gold paste and package lid were used, and logic circuit operation was demonstrated for 143.5 hours at 700 °C.

  4. New microwave excitation signal generating circuit for quantum frequency standard on the atoms of caesium Cs133

    NASA Astrophysics Data System (ADS)

    Petrov, A. A.; Davydov, V. V.

    2016-03-01

    In this work the study, design, development and experimental results of a new microwave excitation signal generating circuit are presented. New design of this circuit is based on the method of direct digital synthesis. The results of theoretical calculations and experimental researches show that the new design not only has a high precision, but also has an improvement in the spectral characteristics of the output signal. Range of generated output frequencies is expanded, that leads to the possibility of detuning the frequency of the neighboring resonance of spectral line and adjust the C-field in quantum frequency standard. Experimental research of the metrological characteristics of the quantum frequency standard on the atoms of caesium with a new functional unit showed an improvement in the daily frequency stability.

  5. Validation Testing of Hydrogen Generation Technology

    SciTech Connect

    Smith, Barton; Toops, Todd J

    2007-12-01

    This report describes the results of testing performed by ORNL for Photech Energies, Inc. The objective of the testing was to evaluate the efficacy of Photech's hydrogen generation reactor technology, which produces gaseous hydrogen through electrolysis. Photech provided several prototypes of their proprietary reactor for testing and the ancillary equipment, such as power supplies and electrolyte solutions, required for proper operation of the reactors. ORNL measured the production of hydrogen gas (volumetric flow of hydrogen at atmospheric pressure) as a function of input power and analyzed the composition of the output stream to determine the purity of the hydrogen content. ORNL attempted measurements on two basic versions of the prototype reactors-one version had a clear plastic outer cylinder, while another version had a stainless steel outer cylinder-but was only able to complete measurements on reactors in the plastic version. The problem observed in the stainless steel reactors was that in these reactors most of the hydrogen was produced near the anodes along with oxygen and the mixed gases made it impossible to determine the amount of hydrogen produced. In the plastic reactors the production of hydrogen gas increased monotonically with input power, and the flow rates increased faster at low input powers than they did at higher input powers. The maximum flow rate from the cathode port measured during the tests was 0.85 LPM at an input power of about 1100 W, an electrolyte concentration of 20%. The composition of the flow from the cathode port was primarily hydrogen and water vapor, with some oxygen and trace amounts of carbon dioxide. An operational mode that occurs briefly during certain operating conditions, and is characterized by flashes of light and violent bubbling near the cathode, might be attributable to the combustion of hydrogen and oxygen in the electrolyte solution.

  6. Thermal hydraulic performance testing of printed circuit heat exchangers in a high-temperature helium test facility

    SciTech Connect

    Sai K. Mylavarapu; Xiaodong Sun; Richard E. Glosup; Richard N. Christensen; Michael W. Patterson

    2014-04-01

    In high-temperature gas-cooled reactors, such as a very high temperature reactor (VHTR), an intermediate heat exchanger (IHX) is required to efficiently transfer the core thermal output to a secondary fluid for electricity generation with an indirect power cycle and/or process heat applications. Currently, there is no proven high-temperature (750–800 °C or higher) compact heat exchanger technology for high-temperature reactor design concepts. In this study, printed circuit heat exchanger (PCHE), a potential IHX concept for high-temperature applications, has been investigated for their heat transfer and pressure drop characteristics under high operating temperatures and pressures. Two PCHEs, each having 10 hot and 10 cold plates with 12 channels (semicircular cross-section) in each plate are fabricated using Alloy 617 plates and tested for their performance in a high-temperature helium test facility (HTHF). The PCHE inlet temperature and pressure were varied from 85 to 390 °C/1.0–2.7 MPa for the cold side and 208–790 °C/1.0–2.7 MPa for the hot side, respectively, while the mass flow rate of helium was varied from 15 to 49 kg/h. This range of mass flow rates corresponds to PCHE channel Reynolds numbers of 950 to 4100 for the cold side and 900 to 3900 for the hot side (corresponding to the laminar and laminar-to-turbulent transition flow regimes). The obtained experimental data have been analyzed for the pressure drop and heat transfer characteristics of the heat transfer surface of the PCHEs and compared with the available models and correlations in the literature. In addition, a numerical treatment of hydrodynamically developing and hydrodynamically fully-developed laminar flow through a semicircular duct is presented. Relations developed for determining the hydrodynamic entrance length in a semicircular duct and the friction factor (or pressure drop) in the hydrodynamic entry length region for laminar flow through a semicircular duct are given. Various

  7. Development and Analysis of Cold Trap for Use in Fission Surface Power-Primary Test Circuit

    NASA Technical Reports Server (NTRS)

    Wolfe, T. M.; Dervan, C. A.; Pearson, J. B.; Godfroy, T. J.

    2012-01-01

    The design and analysis of a cold trap proposed for use in the purification of circulated eutectic sodium potassium (NaK-78) loops is presented. The cold trap is designed to be incorporated into the Fission Surface Power-Primary Test Circuit (FSP-PTC), which incorporates a pumped NaK loop to simulate in-space nuclear reactor-based technology using non-nuclear test methodology as developed by the Early Flight Fission-Test Facility. The FSP-PTC provides a test circuit for the development of fission surface power technology. This system operates at temperatures that would be similar to those found in a reactor (500-800 K). By dropping the operating temperature of a specified percentage of NaK flow through a bypass containing a forced circulation cold trap, the NaK purity level can be increased by precipitating oxides from the NaK and capturing them within the cold trap. This would prevent recirculation of these oxides back through the system, which may help prevent corrosion.

  8. DEVELOPMENT, TESTING, AND DEMONSTRATION OF AN OPTIMAL FINE COAL CLEANING CIRCUIT

    SciTech Connect

    Steven R. Hadley; R. Mike Mishra; Michael Placha

    1999-01-27

    The objective of this project was to improve the efficiency of the fine coal froth flotation circuit in commercial coal preparation plants. The plant selected for this project, Cyprus Emerald Coal Preparation Plant, cleans 1200-1400 tph of Pittsburgh seam raw coal and uses conventional flotation cells to clean the minus 100-mesh size fraction. The amount of coal in this size fraction is approximately 80 tph with an average ash content of 35%. The project was carried out in two phases. In Phase I, four advanced flotation cells, i.e., a Jameson cell, an Outokumpu HG tank cell, an open column, and a packed column cell, were subjected to bench-scale testing and demonstration. In Phase II, two of these flotation cells, the Jameson cell and the packed column, were subjected to in-plant, proof-of-concept (POC) pilot plant testing both individually and in two-stage combination in order to ascertain whether a two-stage circuit results in lower levelized production costs. The bench-scale results indicated that the Jameson cell and packed column cell would be amenable to the single- and two-stage flotation approach. POC tests using these cells determined that single-stage coal matter recovery (CMR) of 85% was possible with a product ash content of 5.5-7%. Two-stage operation resulted in a coal recovery of 90% with a clean coal ash content of 6-7.5%. This compares favorably with the plant flotation circuit recovery of 80% at a clean coal ash of 11%.

  9. A rule-based software test data generator

    NASA Technical Reports Server (NTRS)

    Deason, William H.; Brown, David B.; Chang, Kai-Hsiung; Cross, James H., II

    1991-01-01

    Rule-based software test data generation is proposed as an alternative to either path/predicate analysis or random data generation. A prototype rule-based test data generator for Ada programs is constructed and compared to a random test data generator. Four Ada procedures are used in the comparison. Approximately 2000 rule-based test cases and 100,000 randomly generated test cases are automatically generated and executed. The success of the two methods is compared using standard coverage metrics. Simple statistical tests showing that even the primitive rule-based test data generation prototype is significantly better than random data generation are performed. This result demonstrates that rule-based test data generation is feasible and shows great promise in assisting test engineers, especially when the rule base is developed further.

  10. A rule-based software test data generator

    NASA Technical Reports Server (NTRS)

    Deason, William H.; Brown, David B.; Chang, Kai-Hsiung; Cross, James H., II

    1991-01-01

    Rule-based software test data generation is proposed as an alternative to either path/predicate analysis or random data generation. A prototype rule-based test data generator for Ada programs is constructed and compared to a random test data generator. Four Ada procedures are used in the comparison. Approximately 2000 rule-based test cases and 100,000 randomly generated test cases are automatically generated and executed. The success of the two methods is compared using standard coverage metrics. Simple statistical tests showing that even the primitive rule-based test data generation prototype is significantly better than random data generation are performed. This result demonstrates that rule-based test data generation is feasible and shows great promise in assisting test engineers, especially when the rule base is developed further.

  11. Magnetic Circuit Model of PM Motor-Generator to Predict Radial Forces

    NASA Technical Reports Server (NTRS)

    McLallin, Kerry (Technical Monitor); Kascak, Peter E.; Dever, Timothy P.; Jansen, Ralph H.

    2004-01-01

    A magnetic circuit model is developed for a PM motor for flywheel applications. A sample motor is designed and modeled. Motor configuration and selection of materials is discussed, and the choice of winding configuration is described. A magnetic circuit model is described, which includes the stator back iron, rotor yoke, permanent magnets, air gaps and the stator teeth. Iterative solution of this model yields flux linkages, back EMF, torque, power, and radial force at the rotor caused by eccentricity. Calculated radial forces are then used to determine motor negative stiffness.

  12. Generation of copper rich metallic phases from waste printed circuit boards.

    PubMed

    Cayumil, R; Khanna, R; Ikram-Ul-Haq, M; Rajarao, R; Hill, A; Sahajwalla, V

    2014-10-01

    The rapid consumption and obsolescence of electronics have resulted in e-waste being one of the fastest growing waste streams worldwide. Printed circuit boards (PCBs) are among the most complex e-waste, containing significant quantities of hazardous and toxic materials leading to high levels of pollution if landfilled or processed inappropriately. However, PCBs are also an important resource of metals including copper, tin, lead and precious metals; their recycling is appealing especially as the concentration of these metals in PCBs is considerably higher than in their ores. This article is focused on a novel approach to recover copper rich phases from waste PCBs. Crushed PCBs were heat treated at 1150°C under argon gas flowing at 1L/min into a horizontal tube furnace. Samples were placed into an alumina crucible and positioned in the cold zone of the furnace for 5 min to avoid thermal shock, and then pushed into the hot zone, with specimens exposed to high temperatures for 10 and 20 min. After treatment, residues were pulled back to the cold zone and kept there for 5 min to avoid thermal cracking and re-oxidation. This process resulted in the generation of a metallic phase in the form of droplets and a carbonaceous residue. The metallic phase was formed of copper-rich red droplets and tin-rich white droplets along with the presence of several precious metals. The carbonaceous residue was found to consist of slag and ∼30% carbon. The process conditions led to the segregation of hazardous lead and tin clusters in the metallic phase. The heat treatment temperature was chosen to be above the melting point of copper; molten copper helped to concentrate metallic constituents and their separation from the carbonaceous residue and the slag. Inert atmosphere prevented the re-oxidation of metals and the loss of carbon in the gaseous fraction. Recycling e-waste is expected to lead to enhanced metal recovery, conserving natural resources and providing an environmentally

  13. The Automated DC Parameter Testing of GaAs MESFETs Using the Singer Automatic Integrated Circuit Test System.

    DTIC Science & Technology

    1980-09-01

    Equivalent GaAs MESFET Circuit Model 37 11 Hower’s Equivalent GaAs MESFET Circuit Model 38 12 Modified DC Equivalent Circuit Model of...I Truth Table for the GaAs MESFET Logic Gate of Figure 1 29 II Equivalent - Circuit Parameters of a GaAs MESFET with a 1 micron x 500 micron Gate 39...using Schottky diodes in the output buffer circuit . The number of diodes required is determined by the pinchoff voltage of the

  14. Modeling of all-optical even and odd parity generator circuits using metal-insulator-metal plasmonic waveguides

    NASA Astrophysics Data System (ADS)

    Singh, Lokendra; Bedi, Amna; Kumar, Santosh

    2017-06-01

    Plasmonic metal-insulator-metal (MIM) waveguides sustain excellent property of confining the surface plasmons up to a deep subwavelength scale. In this paper, linear and S-shaped MIM waveguides are cascaded together to design the model of Mach-Zehnder interferometer (MZI). Nonlinear material has been used for switching of light across its output ports. The structures of even and odd parity generators are projected by cascading the MZIs. Parity generator and checker circuit are used for error correction and detection in an optical communication system. Study and analysis of proposed designs are carried out by using the MATLAB simulation and finite-differencetime-domain (FDTD) method.

  15. Modeling of all-optical even and odd parity generator circuits using metal-insulator-metal plasmonic waveguides

    NASA Astrophysics Data System (ADS)

    Singh, Lokendra; Bedi, Amna; Kumar, Santosh

    2017-01-01

    Plasmonic metal-insulator-metal (MIM) waveguides sustain excellent property of confining the surface plasmons up to a deep subwavelength scale. In this paper, linear and S-shaped MIM waveguides are cascaded together to design the model of Mach-Zehnder interferometer (MZI). Nonlinear material has been used for switching of light across its output ports. The structures of even and odd parity generators are projected by cascading the MZIs. Parity generator and checker circuit are used for error correction and detection in an optical communication system. Study and analysis of proposed designs are carried out by using the MATLAB simulation and finite-differencetime-domain (FDTD) method.

  16. Ubiquity of chaotic magnetic-field lines generated by three-dimensionally crossed wires in modern electric circuits.

    PubMed

    Hosoda, M; Miyaguchi, T; Imagawa, K; Nakamura, K

    2009-12-01

    We investigate simple three-dimensionally crossed wires carrying electric currents which generate chaotic magnetic-field lines (CMFLs). As such wire systems, cross-ring and perturbed parallel-ring wires are studied, since topologically equivalent configurations to these systems can often be found in contemporary electric and integrated circuits. For realistic fundamental wire configurations, the conditions for wire dimensions (size) and current values to generate CMFLs are numerically explored under the presence of the weak but inevitable geomagnetic field. As a result, it is concluded that CMFLs can exist everywhere; i.e., they are ubiquitous in the modern technological world.

  17. Wein bridge oscillator circuit

    NASA Technical Reports Server (NTRS)

    Lipoma, P. C.

    1971-01-01

    Circuit with minimum number of components provides stable outputs of 2 to 8 volts at frequencies of .001 to 100 kHz. Oscillator exhibits low power consumption, portability, simplicity, and drive capability, it has application as loudspeaker tester and audible alarm, as well as in laboratory and test generators.

  18. Configurable test bed design for nanosats to qualify commercial and customized integrated circuits

    NASA Astrophysics Data System (ADS)

    Guareschi, W.; Azambuja, J.; Kastensmidt, F.; Reis, R.; Durao, O.; Schuch, N.; Dessbesel, G.

    The use of small satellites has increased substantially in recent years due to the reduced cost of their development and launch, as well to the flexibility offered by commercial components. The test bed is a platform that allows components to be evaluated and tested in space. It is a flexible platform, which can be adjusted to a wide quantity of components and interfaces. This work proposes the design and implementation of a test bed suitable for test and evaluation of commercial circuits used in nanosatellites. The development of such a platform allows developers to reduce the efforts in the integration of components and therefore speed up the overall system development time. The proposed test bed is a configurable platform implemented using a Field Programmable Gate Array (FPGA) that controls the communication protocols and connections to the devices under test. The Flash-based ProASIC3E FPGA from Microsemi is used as a control system. This adaptive system enables the control of new payloads and softcores for test and validation in space. Thus, the integration can be easily performed through configuration parameters. It is intended for modularity. Each component connected to the test bed can have a specific interface programmed using a hardware description language (HDL). The data of each component is stored in embedded memories. Each component has its own memory space. The size of the allocated memory can be also configured. The data transfer priority can be set and packaging can be added to the logic, when needed. Communication with peripheral devices and with the Onboard Computer (OBC) is done through the pre-implemented protocols, such as I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface) and external memory control. In loco primary tests demonstrated the control system's functionality. The commercial ProASIC3E FPGA family is not space-flight qualified, but tests have been made under Total Ionizing Dose (TID) showing its robustness up to 25 kr

  19. Disparate SPF testing methodologies generate similar SPFs.

    PubMed

    Garzarella, Katherine; Caswell, Michael

    2013-01-01

    Regulatory agencies throughout the world have developed exclusive methodologies for assessing and classifying sunscreen product efficacy in their respective markets. Three prevalent methods, the Food and Drug Administration-Final Monograph (FDA-FM) method, the Australia/New Zealand (Aus/NZ) method, and the COLIPA International (International) method, contain procedural and statistical dissimilarities with undefined significance. The objective of our clinical trials was to evaluate the influence of these disparities on sun protection factor (SPF) values. Our clinical trials evaluated the SPF of 59 test materials, using two or all three of the aforementioned methods in simultaneous trials, providing two or three SPF values for each formulation. A total of 135 trials were conducted. The consequent mean SPF values generated per trial were used to compare methods in a correlation and variance analysis. The correlation coefficients for each method pair, International vs. FDA-FM, Aus/NZ vs. FDA-FM, and International vs. Aus/NZ, were each ≥0.94. The difference in least square mean SPF for each method pair was 0.12, 0.62, and 0.81, respectively. Our juxtaposition of the mean SPFs produced by these methods clearly illustrate that any disparities between average SPF values produced by these methods are not clinically or statistically significant and that using one method should be sufficient for SPF labeling in all three respective markets.

  20. Double-layer rotor magnetic shield performance analysis in high temperature superconducting synchronous generators under short circuit fault conditions

    NASA Astrophysics Data System (ADS)

    Hekmati, Arsalan; Aliahmadi, Mehdi

    2016-12-01

    High temperature superconducting, HTS, synchronous machines benefit from a rotor magnetic shield in order to protect superconducting coils against asynchronous magnetic fields. This magnetic shield, however, suffers from exerted Lorentz forces generated in light of induced eddy currents during transient conditions, e.g. stator windings short-circuit fault. In addition, to the exerted electromagnetic forces, eddy current losses and the associated effects on the cryogenic system are the other consequences of shielding HTS coils. This study aims at investigating the Rotor Magnetic Shield, RMS, performance in HTS synchronous generators under stator winding short-circuit fault conditions. The induced eddy currents in different circumferential positions of the rotor magnetic shield along with associated Joule heating losses would be studied using 2-D time-stepping Finite Element Analysis, FEA. The investigation of Lorentz forces exerted on the magnetic shield during transient conditions has also been performed in this paper. The obtained results show that double line-to-ground fault is of the most importance among different types of short-circuit faults. It was revealed that when it comes to the design of the rotor magnetic shields, in addition to the eddy current distribution and the associated ohmic losses, two phase-to-ground fault should be taken into account since the produced electromagnetic forces in the time of fault conditions are more severe during double line-to-ground fault.

  1. Gap Junction-Mediated Signaling from Motor Neurons Regulates Motor Generation in the Central Circuits of Larval Drosophila.

    PubMed

    Matsunaga, Teruyuki; Kohsaka, Hiroshi; Nose, Akinao

    2017-02-22

    In this study, we used the peristaltic crawling of Drosophila larvae as a model to study how motor patterns are regulated by central circuits. We built an experimental system that allows simultaneous application of optogenetics and calcium imaging to the isolated ventral nerve cord (VNC). We then investigated the effects of manipulating local activity of motor neurons (MNs) on fictive locomotion observed as waves of MN activity propagating along neuromeres. Optical inhibition of MNs with halorhodopsin3 in a middle segment (A4, A5, or A6), but not other segments, dramatically decreased the frequency of the motor waves. Conversely, local activation of MNs with channelrhodopsin2 in a posterior segment (A6 or A7) increased the frequency of the motor waves. Since peripheral nerves mediating sensory feedback were severed in the VNC preparation, these results indicate that MNs send signals to the central circuits to regulate motor pattern generation. Our results also indicate segmental specificity in the roles of MNs in motor control. The effects of the local MN activity manipulation were lost in shaking-B(2) (shakB(2) ) or ogre(2) , gap-junction mutations in Drosophila, or upon acute application of the gap junction blocker carbenoxolone, implicating electrical synapses in the signaling from MNs. Cell-type-specific RNAi suggested shakB and ogre function in MNs and interneurons, respectively, during the signaling. Our results not only reveal an unexpected role for MNs in motor pattern regulation, but also introduce a powerful experimental system that enables examination of the input-output relationship among the component neurons in this system.SIGNIFICANCE STATEMENT Motor neurons are generally considered passive players in motor pattern generation, simply relaying information from upstream interneuronal circuits to the target muscles. This study shows instead that MNs play active roles in the control of motor generation by conveying information via gap junctions to the

  2. The New Generation of Standardized Testing.

    ERIC Educational Resources Information Center

    Lynd, Christine

    High-stakes testing is one of the hottest topics in education today. Although most states use some form of testing, fewer than half administer tests linked to state education standards and goals, often called criterion referenced tests. Fewer still use statewide tests with high stakes for both the students enrolled in the public schools and the…

  3. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating...

  4. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating...

  5. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such...

  6. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such...

  7. Development, testing, and demonstration of an optimal fine coal cleaning circuit

    SciTech Connect

    Mishra, M.; Placha, M.; Bethell, P.

    1995-11-01

    The overall objective of this project is to improve the efficiency of fine coal cleaning. The project will be completed in two phases: bench-scale testing and demonstration of four advanced flotation cells and; in-plant proof-of-concept (POC) pilot plant testing of two flotation cells individually and in two-stage combinations. The goal is to ascertain if a two-stage circuit can result in reduced capital and operating costs while achieving improved separation efficiency. The plant selected for this project, Cyprus Emerald Coal Preparation plant, cleans 1200 tph of raw coal. The plant produces approximately 4 million tonnes of clean coal per year at an average as received energy content of 30.2 MJ/Kg (13,000 Btu/lb).

  8. Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space

    NASA Technical Reports Server (NTRS)

    Johnston, Allan H.; Rax, Bernard G.

    2006-01-01

    This paper discusses mechanisms and circuit-related factors that affect the degradation of linear integrated circuits from radiation in space. For some circuits there is sufficient degradation to affect performance at total dose levels below 4 krad(Si) because the circuit design techniques require higher gain for the pnp transistors that are the most sensitive to radiation. Qualification methods are recommended that include displacement damage as well as ionization damage.

  9. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and suggested...

  10. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and suggested...

  11. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods for SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 to subpart B of part 53 specifies preferred methods for generating test atmospheres and suggested...

  12. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is a...

  13. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is a...

  14. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is a...

  15. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is a...

  16. 21 CFR 882.1430 - Electroencephalograph test signal generator.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Electroencephalograph test signal generator. 882.1430 Section 882.1430 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN... Electroencephalograph test signal generator. (a) Identification. An electroencephalograph test signal generator is a...

  17. 40 CFR 53.22 - Generation of test atmospheres.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 5 2011-07-01 2011-07-01 false Generation of test atmospheres. 53.22... Characteristics of Automated Methods SO2, CO, O3, and NO2 § 53.22 Generation of test atmospheres. (a) Table B-2 specifies preferred methods for generating test atmospheres and suggested methods of verifying...

  18. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 47 Telecommunication 5 2010-10-01 2010-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in...

  19. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 47 Telecommunication 5 2013-10-01 2013-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

  20. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 47 Telecommunication 5 2012-10-01 2012-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

  1. 47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 47 Telecommunication 5 2014-10-01 2014-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

  2. Next-generation transgenic mice for optogenetic analysis of neural circuits

    PubMed Central

    Asrican, Brent; Augustine, George J.; Berglund, Ken; Chen, Susu; Chow, Nick; Deisseroth, Karl; Feng, Guoping; Gloss, Bernd; Hira, Riichiro; Hoffmann, Carolin; Kasai, Haruo; Katarya, Malvika; Kim, Jinsook; Kudolo, John; Lee, Li Ming; Lo, Shun Qiang; Mancuso, James; Matsuzaki, Masanori; Nakajima, Ryuichi; Qiu, Li; Tan, Gregory; Tang, Yanxia; Ting, Jonathan T.; Tsuda, Sachiko; Wen, Lei; Zhang, Xuying; Zhao, Shengli

    2013-01-01

    Here we characterize several new lines of transgenic mice useful for optogenetic analysis of brain circuit function. These mice express optogenetic probes, such as enhanced halorhodopsin or several different versions of channelrhodopsins, behind various neuron-specific promoters. These mice permit photoinhibition or photostimulation both in vitro and in vivo. Our results also reveal the important influence of fluorescent tags on optogenetic probe expression and function in transgenic mice. PMID:24324405

  3. In-plant testing of a novel coal cleaning circuit using advanced technologies, Quarterly report, March 1 - May 31, 1996

    SciTech Connect

    Honaker, R.Q.; Reed, S.; Mohanty, M.K.

    1996-12-31

    Research conducted at Southern Illinois University at Carbondale over the past two years has identified highly efficient methods for treating fine coal (i.e., -28 mesh). In this study, a circuit comprised of the three advanced fine coal cleaning technologies is being tested in an operating preparation plant to evaluate circuit performance and to compare the performance with the current technologies used to treat -16 mesh fine coal. The circuit integrated a Floatex hydrosizer, a Falcon concentrator and a Jameson froth flotation cell. The Floatex hydrosizer is being used as a primary cleaner for the nominally -16 mesh Illinois No. 5 fine coal circuit feed. The overflow of the Floatex is screened at 48 mesh using a Sizetec vibratory screen to produce a clean coal product from the screen overflow. The screen overflow is further treated by the Falcon and Jameson Cell. During this reporting period, tests were initiated on the fine coal circuit installed at the Kerr-McGee Galatia preparation plant. The circuit was found to reduce both the ash content and the pyritic sulfur content. Additional in-plant circuitry tests are ongoing.

  4. "MSTGen": Simulated Data Generator for Multistage Testing

    ERIC Educational Resources Information Center

    Han, Kyung T.

    2013-01-01

    Multistage testing, or MST, was developed as an alternative to computerized adaptive testing (CAT) for applications in which it is preferable to administer a test at the level of item sets (i.e., modules). As with CAT, the simulation technique in MST plays a critical role in the development and maintenance of tests. "MSTGen," a new MST…

  5. "MSTGen": Simulated Data Generator for Multistage Testing

    ERIC Educational Resources Information Center

    Han, Kyung T.

    2013-01-01

    Multistage testing, or MST, was developed as an alternative to computerized adaptive testing (CAT) for applications in which it is preferable to administer a test at the level of item sets (i.e., modules). As with CAT, the simulation technique in MST plays a critical role in the development and maintenance of tests. "MSTGen," a new MST…

  6. A Series of Suppressive Signals within the Drosophila Circadian Neural Circuit Generates Sequential Daily Outputs.

    PubMed

    Liang, Xitong; Holy, Timothy E; Taghert, Paul H

    2017-06-21

    We studied the Drosophila circadian neural circuit using whole-brain imaging in vivo. Five major groups of pacemaker neurons display synchronized molecular clocks, yet each exhibits a distinct phase of daily Ca(2+) activation. Light and neuropeptide pigment dispersing factor (PDF) from morning cells (s-LNv) together delay the phase of the evening (LNd) group by ∼12 hr; PDF alone delays the phase of the DN3 group by ∼17 hr. Neuropeptide sNPF, released from s-LNv and LNd pacemakers, produces Ca(2+) activation in the DN1 group late in the night. The circuit also features negative feedback by PDF to truncate the s-LNv Ca(2+) wave and terminate PDF release. Both PDF and sNPF suppress basal Ca(2+) levels in target pacemakers with long durations by cell-autonomous actions. Thus, light and neuropeptides act dynamically at distinct hubs of the circuit to produce multiple suppressive events that create the proper tempo and sequence of circadian pacemaker neuronal activities. Copyright © 2017 Elsevier Inc. All rights reserved.

  7. A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

    NASA Astrophysics Data System (ADS)

    San-Um, Wimol; Tachibana, Masayoshi

    An analog circuit testing scheme is presented. The testing technique is a sinusoidal fault signature characterization, involving the measurement of DC offset, amplitude, frequency and phase shift, and the realization of two crossing level voltages. The testing system is an extension of the IEEE 1149.4 standard through the modification of an analog boundary module, affording functionalities for both on-chip testing capability, and accessibility to internal components for off-chip testing. A demonstrating circuit-under-test, a 4th-order Gm-C low-pass filter, and the proposed analog testing scheme are implemented in a physical level using 0.18-µm CMOS technology, and simulated using Hspice. Both catastrophic and parametric faults are potentially detectable at the minimum parameter variation of 0.5%. The fault coverage associated with CMOS transconductance operational amplifiers and capacitors are at 94.16% and 100%, respectively. This work offers the enhancement of standardizing test approach, which reduces the complexity of testing circuit and provides non-intrusive analog circuit testing.

  8. Testing Procedures for Open Circuit Air Diving H ELMETS AND Semi-Closed Circuit Mixed Gas Diving Helmets

    DTIC Science & Technology

    1973-12-18

    indicator against a water or mercury manometer prior to each major test. Recheck calibration at the end of the test. f. Test conditions and General...check calibrations at the conclusion of the test. 2) The transducer should be calibratedagainst a water or mercury manometer ; the thermistor against...2) The transducer should be calibrated against a water or mercury manometer ; the thermistor against 32 0 F water and room temperature. 3) The

  9. Effects of ion channel noise on neural circuits: an application to the respiratory pattern generator to investigate breathing variability.

    PubMed

    Yu, Haitao; Dhingra, Rishi R; Dick, Thomas E; Galán, Roberto F

    2017-01-01

    Neural activity generally displays irregular firing patterns even in circuits with apparently regular outputs, such as motor pattern generators, in which the output frequency fluctuates randomly around a mean value. This "circuit noise" is inherited from the random firing of single neurons, which emerges from stochastic ion channel gating (channel noise), spontaneous neurotransmitter release, and its diffusion and binding to synaptic receptors. Here we demonstrate how to expand conductance-based network models that are originally deterministic to include realistic, physiological noise, focusing on stochastic ion channel gating. We illustrate this procedure with a well-established conductance-based model of the respiratory pattern generator, which allows us to investigate how channel noise affects neural dynamics at the circuit level and, in particular, to understand the relationship between the respiratory pattern and its breath-to-breath variability. We show that as the channel number increases, the duration of inspiration and expiration varies, and so does the coefficient of variation of the breath-to-breath interval, which attains a minimum when the mean duration of expiration slightly exceeds that of inspiration. For small channel numbers, the variability of the expiratory phase dominates over that of the inspiratory phase, and vice versa for large channel numbers. Among the four different cell types in the respiratory pattern generator, pacemaker cells exhibit the highest sensitivity to channel noise. The model shows that suppressing input from the pons leads to longer inspiratory phases, a reduction in breathing frequency, and larger breath-to-breath variability, whereas enhanced input from the raphe nucleus increases breathing frequency without changing its pattern.

  10. Characteristics analysis of a high speed permanent magnet synchronous generator using the transfer relations theorem and equivalent circuit method

    NASA Astrophysics Data System (ADS)

    Jang, Seok-Myeong; Ko, Kyoung-Jin; Park, Ji-Hoon; Cho, Han-Wook; Hong, Jung-Pyo

    2008-04-01

    This paper presents analytical methods to predict the magnetic field distribution, electrical parameters, and output characteristics of a high speed synchronous generator equipped with surface-mounted permanent magnet. In order to analyze the magnetic field distribution and to estimate the electrical parameters, electromagnetic transfer relation (TR) theorem is employed. Moreover, output characteristics for variable resistive load and the operating speed are also obtained by solving the permanent magnet machine's equivalent circuit equation. The analytical results are validated extensively by nonlinear finite element analysis and experimental results.

  11. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics

    NASA Technical Reports Server (NTRS)

    Kory, Carol L.; Dayton, James A., Jr.

    1997-01-01

    Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis to determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods. Previous computer analyses required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.

  12. Theoretical study of the circuit architecture of the basic CFOA and testing techniques

    NASA Astrophysics Data System (ADS)

    Tammam, A. A.; Hayatleh, K.; Barker, S.; Terzopoulos, N.

    2016-09-01

    This paper examines the closed-loop characteristics of the basic Current-Feedback Operational Amplifier (CFOA), and in particular, the dynamic response. Additionally, it also examines the design and advantages of the CFOA regarding its ability to provide a significantly constant closed-loop bandwidth for closed-loop voltage gain. Secondly, the almost limitless slew-rate provided by the class AB input stage that makes it superior to the voltage-mode operational amplifier (VOA) counterpart. Additionally, this paper also concerns the definitions and measurements of the terminal parameters of the CFOA, regarded as a 'black box'. It does not deal with the way that these parameters are related to the properties of the active passive and active components of a particular circuit configuration. Simulation is used in terminal parameter determination: this brings with it the facility of using test conditions that would not normally prevail in a laboratory test on silicon implementations of the CFOAs. Thus, we can apply 1mA and 1mV test signals from, respectively, infinite and zero source impedances that range in frequency from d.c to some tens of GHz. Also, we assume the existence of resistors with identical Ohmic value and very high value ideal capacitors. Where appropriate, practical test methods are referred to physical laboratory prototypes.

  13. The Full Function Test Explosive Generator

    SciTech Connect

    Reisman, D B; Javedani, J B; Griffith, L V; Ellsworth, G F; Kuklo, R M; Goerz, D A; White, A D; Tallerico, L J; Gidding, D A; Murphy, M J; Chase, J B

    2009-12-13

    We have conducted three tests of a new pulsed power device called the Full Function Test (FFT). These tests represented the culmination of an effort to establish a high energy pulsed power capability based on high explosive pulsed power (HEPP) technology. This involved an extensive computational modeling, engineering, fabrication, and fielding effort. The experiments were highly successful and a new US record for magnetic energy was obtained.

  14. Adding Test Generation to the Teaching Machine

    ERIC Educational Resources Information Center

    Bruce-Lockhart, Michael; Norvell, Theodore; Crescenzi, Pierluigi

    2009-01-01

    We propose an extension of the Teaching Machine project, called Quiz Generator, that allows instructors to produce assessment quizzes in the field of algorithm and data structures quite easily. This extension makes use of visualization techniques and is based on new features of the Teaching Machine that allow third-party visualizers to be added as…

  15. Adding Test Generation to the Teaching Machine

    ERIC Educational Resources Information Center

    Bruce-Lockhart, Michael; Norvell, Theodore; Crescenzi, Pierluigi

    2009-01-01

    We propose an extension of the Teaching Machine project, called Quiz Generator, that allows instructors to produce assessment quizzes in the field of algorithm and data structures quite easily. This extension makes use of visualization techniques and is based on new features of the Teaching Machine that allow third-party visualizers to be added as…

  16. State-of-the-art assessment of testing and testability of custom LSI/VLSI circuits. Volume 8: Fault simulation

    NASA Astrophysics Data System (ADS)

    Breuer, M. A.; Carlan, A. J.

    1982-10-01

    Fault simulation is widely used by industry in such applications as scoring the fault coverage of test sequences and construction of fault dictionaries. For use in testing VLSI circuits a simulator is evaluated by its accuracy, i.e., modelling capability. To be accurate simulators must employ multi-valued logic in order to represent unknown signal values, impedance, signal transitions, etc., circuit delays such as transport rise/fall, inertial, and the fault modes it is capable of handling. Of the three basic fault simulators now in use (parallel, deductive and concurrent) concurrent fault simulation appears most promising.

  17. Generating and stabilizing the Greenberger-Horne-Zeilinger state in circuit QED: Joint measurement, Zeno effect, and feedback

    SciTech Connect

    Feng Wei; Wang Peiyue; Ding Xinmei; Xu Luting; Li Xinqi

    2011-04-15

    In a solid-state circuit QED system, we extend the previous study of generating and stabilizing a two-qubit Bell state [Phys. Rev. A 82, 032335 (2010)] to a three-qubit GHZ state. In a dispersive regime, we employ the homodyne joint readout for multiple qubits to infer the state for further processing, and in particular we use it to stabilize the state directly by means of an alternate-flip-interrupted Zeno (AFIZ) scheme. Moreover, the state-of-the-art feedback action based on the filtered current enables not only a deterministic generation of the pre-GHZ state in the initial stage, but also a fast recovery from occasional error in the later stabilization process. We show that the proposed scheme can maintain the state with high fidelity if the efficient quantum measurement and rapid single-qubit rotations are available.

  18. Test-Aerosol Generator For Calibrating Particle Counters

    NASA Technical Reports Server (NTRS)

    Mogan, Paul A.; Adams, Alois J.; Schwindt, Christian J.; Hodge, Timothy R.; Mallow, Tim J.; Duong, Anh A.; Bukauskas, Vyto V.

    1996-01-01

    Apparatus generates clean, stable aerosol stream for use in testing and calibrating laser-based aerosol-particle counter. Size and concentration of aerosol particles controlled to ensure accurate calibration. Cheap, widely available medical nebulizers used to generate aerosols.

  19. NEXT GENERATION LEACHING TESTS FOR EVALUATING ...

    EPA Pesticide Factsheets

    In the U.S. as in other countries, there is increased interest in using industrial by-products as alternative or secondary materials, helping to conserve virgin or raw materials. The LEAF and associated test methods are being used to develop the source term for leaching or any inorganic constituents of potential concern (COPC) in determining what is environmentally acceptable. The leaching test methods include batch equilibrium, percolation column and semi-dynamic mass transport tests for monolithic and compacted granular materials. By testing over a range of values for pH, liquid/solid ratio, and physical form of the material, this approach allows one data set to be used to evaluate a range of management scenarios for a material, representing different environmental conditions (e.g., disposal or beneficial use). The results from these tests may be interpreted individually or integrated to identify a solid material’s characteristic leaching behavior. Furthermore the LEAF approach provides the ability to make meaningful comparisons of leaching between similar and dissimilar materials from national and worldwide origins. To present EPA's research under SHC to implement validated leaching tests referred to as the Leaching Environmental Assessment Framework (LEAF). The primary focus will be on the guidance for implementation of LEAF describing three case studies for developing source terms for evaluating inorganic constituents.

  20. Techniques for testing the quality of parallel pseudorandom number generators

    SciTech Connect

    Cuccaro, S.A.; Mascagni, M.; Pryor, D.V.

    1995-12-01

    Ensuring that pseudorandom number generators have good randomness properties is more complicated in a multiprocessor implementation than in the uniprocessor case. We discuss simple extensions of uniprocessor testing for SIMD parallel streams, and develop in detail a repeatability test for the SPMD paradigm. Examples of the application of these tests to an additive tagged-Fibonacci generator are also given.

  1. Equivalent-circuit model for slot-effect configuration of an electret-based generator

    NASA Astrophysics Data System (ADS)

    Phu Le, Cuong; Renaud, Michael; Halvorsen, Einar

    2016-11-01

    This paper presents a completely analytical method to build a lumped-model for an electret-based energy harvester. The harvester consists of two patterned electrodes facing movable electret patterns in a slot-effect electrical scheme. A Chebyshev expansion with orthogonal functions to capture singularity effects and Galerkin's method are used to determine fundamental parameters of the equivalent circuit. All important fringing fields in the microscale device are thereby taken into account. For a device example, the calculated parameters of the model agree well with those obtained by finite element modelling. The dynamic behaviour is reproduced by the established model. The advantage of the approach is to allow a fast and full exploration of the design parameters for optimization of the device structure.

  2. Laser-based Generation of Conductive Circuits on Additive Manufactured Thermoplastic Substrates

    NASA Astrophysics Data System (ADS)

    Niese, Bernd; Amend, Philipp; Roth, Stephan; Schmidt, Michael

    Shorter production cycles and development times for molded interconnect devices (MID) result in increasing production of cost intensive injection molding tools. Thus, a manufacturing technology for a fast and flexible production of complex prototypes and small series without the use of additional tools is needed. A possible solution is the layerwise manufacturing of mechatronic components by fused deposition modeling (FDM). By additionally embedding electronical components during the additive manufacturing process, electronic functions can also be integrated. In this paper, an experimental investigation for printing of conductive circuits on FDM components by dispensing silver ink and subsequently sintering by laser irradiation is determined. To prevent infiltration of silver ink into the matrix material after application, important process parameters will be optimized getting a media-tight surface.

  3. State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VI. Redundancy, Testing Circuits, and Codes.

    DTIC Science & Technology

    1982-10-01

    required by the new fault tolerant computers have put new emphasis on the use of redundant circuits. Types of redundancy include parellel , triple modular...fault-tolerant intercomputer architectures ws exemplified by the PRIME project at the University of California -Berkeley. Here the objective is more...PRIME. Thus we note that once the hardware is provided for " universal " connec- tivity and failure isolation, the fault-tolerance capability of these

  4. Dynamic Test Generation for Large Binary Programs

    DTIC Science & Technology

    2009-11-12

    Dalal and Mallows framed this question as a size-dependent sequential search problem, in which each bug has a different probability of being found, or...observed size for each bug. We could then derive for each test run the cutoff according to the Dalal and Mallows rule, then run for, say, twice that number...Software En- gineering). ACM, May 2005. [27] S. R. Dalal and C. L. Mallows . When should one stop testing software. j-J-AM-STAT- ASSOC, 83(403):872–879

  5. Life testing of low-voltage air circuit breaker to assess age-related degradation

    SciTech Connect

    Subudhi, M. )

    1992-03-01

    This paper reports that a DS-416 low-voltage air circuit breaker manufactured by Westinghouse is mechanically cycled to identify age-related degradation in the various breaker subcomponents, specifically in the power-operated mechanism. This accelerated aging test is performed on one breaker unit for over 36 000 cycles. Three separate pole shafts, one with a 60-deg weld, one with a 120-deg weld, and one with a 180-deg weld in the third pole lever, are used to characterize cracking in the welds. In addition, during the testing, three different operating mechanisms and several other parts are replaced as they become inoperable. Among the seven welds on the pole shaft, welds 1 and 3 are found to be critical ones whose fracture can result in misalignment of the pole levers. This can lead to problems with the operating mechanism, including the burning of coils, excessive wear in certain parts, and overstressed linkages. Furthermore, the limiting service life of a number of subcomponents of the power-operated mechanism, including the operating mechanism itself, is assessed.

  6. Flow Quality Studies of the NASA Glenn Research Center Icing Research Tunnel Circuit (1995 Tests)

    NASA Technical Reports Server (NTRS)

    Arrington, E. Allen; Kee-Bowling, Bonnie A.; Gonsalez, Jose C.

    2000-01-01

    The purpose of conducting the flow-field surveys described in this report was to more fully document the flow quality in several areas of the tunnel circuit in the NASA Glenn Research Center Icing Research Tunnel. The results from these surveys provide insight into areas of the tunnel that were known to exhibit poor flow quality characteristics and provide data that will be useful to the design of flow quality improvements and a new heat exchanger for the facility. An instrumented traversing mechanism was used to survey the flow field at several large cross sections of the tunnel loop over the entire speed range of the facility. Flow-field data were collected at five stations in the tunnel loop, including downstream of the fan drive motor housing, upstream and downstream of the heat exchanger, and upstream and downstream of the spraybars located in the settling chamber upstream of the test section. The data collected during these surveys greatly expanded the data base describing the flow quality in each of these areas. The new data matched closely the flow quality trends recorded from earlier tests. Data collected downstream of the heat exchanger and in the settling chamber showed how the configuration of the folded heat exchanger affected the pressure, velocity, and flow angle distributions in these areas. Smoke flow visualization was also used to qualitatively study the flow field in an area downstream of the drive fan and in the settling chamber/contraction section.

  7. Solenoid-Simulation Circuit

    NASA Technical Reports Server (NTRS)

    Simon, R. A.

    1986-01-01

    Electrical properties of solenoids imitated for tests of control circuits. Simulation circuit imitates voltage and current responses of two engine-controlling solenoids. Used in tests of programs of digital engine-control circuits, also provides electronic interface with circuits imitating electrical properties of pressure sensors and linear variable-differential transformers. Produces voltages, currents, delays, and discrete turnon and turnoff signals representing operation of solenoid in engine-control relay. Many such circuits used simulating overall engine circuitry.

  8. 4-bit Bipolar Triangle Voltage Waveform Generator Using Single-Flux-Quantum Circuit

    NASA Astrophysics Data System (ADS)

    Watanabe, Tomoki; Takahashi, Yoshitaka; Shimada, Hiroshi; Maezawa, Masaaki; Mizugaki, Yoshinao

    SFQ digital-to-analog converters (DACs) are one of the candidates for AC voltage standards. We have proposed SFQ-DACs based on frequency modulation (FM). Bipolar output is required for applications of AC voltage standards, while our previous SFQ-DACs generated only positive voltages. In this paper, we present our design of a 4-bit bipolar triangle voltage waveform generator comprising an SFQ-DAC. The waveform generator has two output ports. Synthesized half-period waveforms are alternately generated in one of the output ports. The bipolar output is realized by observing the differential voltage between the ports. We confirmed a 72-μVPP bipolar triangle voltage waveform at the frequency of 35.7 Hz.

  9. Liberation of Printed Circuit Assembly (PCA) and dust generation in relation to mobile phone design in a size reduction process.

    PubMed

    Bachér, J; Kaartinen, T

    2017-02-01

    Complex electronic devices entering our recycling systems often generate losses in the whole treatment chain. For better liberation, crucial for the mechanical separation process, the devices are crushed which also generates dusts that are not recovered. This study investigated the relation between the liberation of Printed Circuit Assembly (PCA) and dust generation in the crushing process of two different types of mobile phone samples. The results revealed that the overall PCA grade in both samples was approximately 70% with around 3.4% dust generation. However, the liberation distribution of PCAs differed between mobile phones resulting in better distribution for sophisticated mobile phones due among other things to the initial size of the phones. Further, the dust fractions comprised both noble and valuable metals but also contaminants that need to be taken into account when further processing is planned. A higher gold concentrate was detected in dusts from regular phones since the protective plastic casing crushed more easily thus exposing the PCA surface for grinding. Copyright © 2016 Elsevier Ltd. All rights reserved.

  10. Characterization of devices, circuits, and high-temperature superconductor transmission lines by electro-optic testing

    NASA Technical Reports Server (NTRS)

    Whitaker, John F.

    1991-01-01

    The development of a capability for testing transmission lines, devices, and circuits using the optically-based technique of electro-optics sampling was the goal of this project. Electro-optic network analysis of a high-speed device was demonstrated. The project involved research on all of the facets necessary in order to realize this result, including the discovery of the optimum electronic pulse source, development of an adequate test fixture, improvement of the electro-optic probe tip, and identification of a device which responded at high frequency but did not oscillate in the test fixture. In addition, during the process of investigating patterned high-critical-temperature superconductors, several non-contacting techniques for the determination of the transport properties of high T(sub c) films were developed and implemented. These are a transient, optical pump-probe, time-resolved reflectivity experiment, an impulsive-stimulated Raman scattering experiment, and a terahertz-beam coherent-spectroscopy experiment. The latter technique has enabled us to measure both the complex refractive index of an MgO substrate used for high-T(sub c) films and the complex conductivity of a YBa2Cu3O(7-x) sample. This information was acquired across an extremely wide frequency range: from the microwave to the submillimeter-wave regime. The experiments on the YBCO were conducted without patterning of, or contact to, the thin film. Thus, the need for the more difficult transmission-line experiments was eliminated. Progress in all of these areas was made and is documented in a number of papers. These papers may be found in the section listing the abstracts of the publications that were issued during the course of the research.

  11. Approximate circuits for increased reliability

    DOEpatents

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-12-22

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  12. Approximate circuits for increased reliability

    SciTech Connect

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-08-18

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the reference circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.

  13. Testing to Characterize the Advanced Stirling Radioisotope Generator Engineering Unit

    NASA Technical Reports Server (NTRS)

    Lewandowski, Edward; Schreiber, Jeffrey

    2010-01-01

    The Advanced Stirling Radioisotope Generator (ASRG), a high efficiency generator, is being considered for space missions. Lockheed Martin designed and fabricated an engineering unit (EU), the ASRG EU, under contract to the Department of Energy. This unit is currently undergoing extended operation testing at the NASA Glenn Research Center to generate performance data and validate life and reliability predictions for the generator and the Stirling convertors. It has also undergone performance tests to characterize generator operation while varying control parameters and system inputs. This paper summarizes and explains test results in the context of designing operating strategies for the generator during a space mission and notes expected differences between the EU performance and future generators.

  14. Model Based Analysis and Test Generation for Flight Software

    NASA Technical Reports Server (NTRS)

    Pasareanu, Corina S.; Schumann, Johann M.; Mehlitz, Peter C.; Lowry, Mike R.; Karsai, Gabor; Nine, Harmon; Neema, Sandeep

    2009-01-01

    We describe a framework for model-based analysis and test case generation in the context of a heterogeneous model-based development paradigm that uses and combines Math- Works and UML 2.0 models and the associated code generation tools. This paradigm poses novel challenges to analysis and test case generation that, to the best of our knowledge, have not been addressed before. The framework is based on a common intermediate representation for different modeling formalisms and leverages and extends model checking and symbolic execution tools for model analysis and test case generation, respectively. We discuss the application of our framework to software models for a NASA flight mission.

  15. Testing polycyclicity of finitely generated rational matrix groups

    NASA Astrophysics Data System (ADS)

    Assmann, Bjoern; Eick, Bettina

    2007-09-01

    We describe algorithms for testing polycyclicity and nilpotency for finitely generated subgroups of mathrm{GL}(d,mathbb{Q}) and thus we show that these properties are decidable. Variations of our algorithm can be used for testing virtual polycyclicity and virtual nilpotency for finitely generated subgroups of mathrm{GL}(d,mathbb{Q}) .

  16. Integrated Circuit Electromagnetic Susceptibility Investigation - Phase 2. Test and Measurement Systems

    DTIC Science & Technology

    1974-07-12

    programmable calculator and a 50-channel scanning digital voltmeter; however, several circuits had to be designed and fabricated to aid in biasing and loading the IC and to interface with the computer.

  17. An Engineering Methodology for Implementing and Testing VLSI (Very Large Scale Integrated) Circuits

    DTIC Science & Technology

    1989-03-01

    part of its software package. Timing analysis, power requirement analysis, and au- tomatic test generation allow the designer to functionally verify...to the supply rails (i.e.. Vss n-devices. Vdd p-devices). A very conservative rule would place one substrate contact for every supply connection...installed on the board to prevent corrosion within the podlet connector. b. Results The operational validation of NPS CORNS8 was accomplished with the same

  18. Fast and simple scheme for generating NOON states of photons in circuit QED

    PubMed Central

    Su, Qi-Ping; Yang, Chui-Ping; Zheng, Shi-Biao

    2014-01-01

    The generation, manipulation and fundamental understanding of entanglement lies at very heart of quantum mechanics. Among various types of entangled states, the NOON states are a kind of special quantum entangled states with two orthogonal component states in maximal superposition, which have a wide range of potential applications in quantum communication and quantum information processing. Here, we propose a fast and simple scheme for generating NOON states of photons in two superconducting resonators by using a single superconducting transmon qutrit. Because only one superconducting qutrit and two resonators are used, the experimental setup for this scheme is much simplified when compared with the previous proposals requiring a setup of two superconducting qutrits and three cavities. In addition, this scheme is easier and faster to implement than the previous proposals, which require using a complex microwave pulse, or a small pulse Rabi frequency in order to avoid nonresonant transitions. PMID:24469334

  19. Fast and simple scheme for generating NOON states of photons in circuit QED.

    PubMed

    Su, Qi-Ping; Yang, Chui-Ping; Zheng, Shi-Biao

    2014-01-28

    The generation, manipulation and fundamental understanding of entanglement lies at very heart of quantum mechanics. Among various types of entangled states, the NOON states are a kind of special quantum entangled states with two orthogonal component states in maximal superposition, which have a wide range of potential applications in quantum communication and quantum information processing. Here, we propose a fast and simple scheme for generating NOON states of photons in two superconducting resonators by using a single superconducting transmon qutrit. Because only one superconducting qutrit and two resonators are used, the experimental setup for this scheme is much simplified when compared with the previous proposals requiring a setup of two superconducting qutrits and three cavities. In addition, this scheme is easier and faster to implement than the previous proposals, which require using a complex microwave pulse, or a small pulse Rabi frequency in order to avoid nonresonant transitions.

  20. LAPACK Working Note 9: A test matrix generation suite

    SciTech Connect

    Demmel, J.; McKenney, A. . Courant Institute)

    1989-02-28

    We discuss the design and implementation of a suite of test matrix generators for testing linear algebra software. These routines generate random matrices with certain properties which are useful for testing linear equation solving, least squares, and eigendecomposition software. These properites include the spectrum, symmetry, bandwidth, norm, sparsity, conditioning (with respect to inversion or for the eigenproblem), type (real or complex), and storage scheme (dense, packed or banded).

  1. Model-Driven Test Generation of Distributed Systems

    NASA Technical Reports Server (NTRS)

    Easwaran, Arvind; Hall, Brendan; Schweiker, Kevin

    2012-01-01

    This report describes a novel test generation technique for distributed systems. Utilizing formal models and formal verification tools, spe cifically the Symbolic Analysis Laboratory (SAL) tool-suite from SRI, we present techniques to generate concurrent test vectors for distrib uted systems. These are initially explored within an informal test validation context and later extended to achieve full MC/DC coverage of the TTEthernet protocol operating within a system-centric context.

  2. Random number generators tested on quantum Monte Carlo simulations.

    PubMed

    Hongo, Kenta; Maezono, Ryo; Miura, Kenichi

    2010-08-01

    We have tested and compared several (pseudo) random number generators (RNGs) applied to a practical application, ground state energy calculations of molecules using variational and diffusion Monte Carlo metheds. A new multiple recursive generator with 8th-order recursion (MRG8) and the Mersenne twister generator (MT19937) are tested and compared with the RANLUX generator with five luxury levels (RANLUX-[0-4]). Both MRG8 and MT19937 are proven to give the same total energy as that evaluated with RANLUX-4 (highest luxury level) within the statistical error bars with less computational cost to generate the sequence. We also tested the notorious implementation of linear congruential generator (LCG), RANDU, for comparison.

  3. Testing of a direct drive generator for wind turbines

    SciTech Connect

    Sondergaard, L.M.

    1996-12-31

    The normal drive train of a wind turbine consists a gearbox and a 4 to 8 poles asynchronous generator. The gearbox is an expensive and unreliable components and this paper deals with testing of a direct drive synchronous generator for a gearless wind turbine. The Danish company Belt Electric has constructed and manufactured a 27 kW prototype radial flux PM-generator (DD600). They have used cheap hard ferrite magnets in the rotor of this PM-generator. This generator has been tested at Riso and the test results are investigated and analyzed in this paper. The tests have been done with three different load types (1: resistance; 2: diode rectifier, DC-capacitor, resistance; 3: AC-capacitor, diode rectifier, DC-capacitor, resistance). 1 ref., 9 figs., 5 tabs.

  4. Proposed minimum requirements for the operational characteristics and testing of closed circuit life support system control electronics.

    PubMed

    Kirk, J C

    1998-01-01

    The popularization and transformation of scuba diving into a broadly practiced sport has served to ignite the interest of technically oriented divers into ever more demanding areas. This, along with the gradual release of military data, equipment, and techniques of closed circuit underwater breathing apparatus, has resulted in a virtual explosion of semiclosed and closed circuit systems for divers. Although many of these systems have been carefully thought out by capable designers, the impulse to rush to market with equipment that has not been fully developed and carefully tested is irresistible to marketers. In addition, the presence of systems developed by well-intentioned and otherwise competent designers who are, nonetheless, inexperienced in the field of life support can result in the sale of failure-prone equipment to divers who lack the knowledge and skills to identify deficiencies before disaster occurs. For this reason, a set of industry standards establishing minimum requirements and testing is needed to guide the designers of this equipment, and to protect the user community from incomplete or inadequate design. Many different technologies go into the development of closed circuit scuba. One key area is the design of electronics to monitor and maintain the critical gas mixtures of the closed circuit loop. Much of the system reliability and inherent danger is resident in the design of the circuitry and the software (if any) that runs it. This article will present a set of proposed minimum requirements, with the goal of establishing a dialog for the creation of guidelines for the classification, rating, design, and testing of embedded electronics for life support systems used in closed circuit applications. These guidelines will serve as the foundation for the later creation of a set of industry specifications.

  5. A Gustatory Neural Circuit of Caenorhabditis elegans Generates Memory-Dependent Behaviors in Na(+) Chemotaxis.

    PubMed

    Wang, Lifang; Sato, Hirofumi; Satoh, Yohsuke; Tomioka, Masahiro; Kunitomo, Hirofumi; Iino, Yuichi

    2017-02-22

    Animals show various behaviors in response to environmental chemicals. These behaviors are often plastic depending on previous experiences. Caenorhabditis elegans, which has highly developed chemosensory system with a limited number of sensory neurons, is an ideal model for analyzing the role of each neuron in innate and learned behaviors. Here, we report a new type of memory-dependent behavioral plasticity in Na(+) chemotaxis generated by the left member of bilateral gustatory neuron pair ASE (ASEL neuron). When worms were cultivated in the presence of Na(+), they showed positive chemotaxis toward Na(+), but when cultivated under Na(+)-free conditions, they showed no preference regarding Na(+) concentration. Both channelrhodopsin-2 (ChR2) activation with blue light and up-steps of Na(+) concentration activated ASEL only after cultivation with Na(+), as judged by increase in intracellular Ca(2+) Under cultivation conditions with Na(+), photoactivation of ASEL caused activation of its downstream interneurons AIY and AIA, which stimulate forward locomotion, and inhibition of its downstream interneuron AIB, which inhibits the turning/reversal behavior, and overall drove worms toward higher Na(+) concentrations. We also found that the Gq signaling pathway and the neurotransmitter glutamate are both involved in the behavioral response generated by ASEL.SIGNIFICANCE STATEMENT Animals have acquired various types of behavioral plasticity during their long evolutionary history. Caenorhabditis elegans prefers odors associated with food, but plastically changes its behavioral response according to previous experience. Here, we report a new type of behavioral response generated by a single gustatory sensory neuron, the ASE-left (ASEL) neuron. ASEL did not respond to photostimulation or upsteps of Na(+) concentration when worms were cultivated in Na(+)-free conditions; however, when worms were cultivated with Na(+), ASEL responded and inhibited AIB to avoid turning and

  6. Efficient scheme for generation of photonic NOON states in circuit QED.

    PubMed

    Xiong, Shao-Jie; Sun, Zhe; Liu, Jin-Ming; Liu, Tong; Yang, Chui-Ping

    2015-05-15

    We propose an efficient scheme for generating photonic NOON states of two resonators coupled to a four-level superconducting flux device (coupler). This proposal operates essentially by employing a technique of a coupler resonantly interacting with two resonators simultaneously. As a consequence, the NOON-state preparation requires only N+1 operational steps and thus is much faster when compared with a recent proposal [Su et al, Sci. Rep.4, 3898 (2014)] requiring 2N steps of operation. Moreover, due to the use of only two resonators and a coupler, the experimental setup is much simplified when compared with previous proposals requiring three resonators and two superconducting qubits/qutrits.

  7. Grumman Windstream 25 wind turbine generator. Final test report

    SciTech Connect

    Sexton, J.H.

    1980-03-01

    The Grumman Windstream 25 Wind Turbine Generator (WTG) tested at the Rocky Flats Small Wind Systems Test Center (WSTC) was one of nineteen Windstream 25's manufactured by Grumman Energy Systems, Inc. The machine was considered a first generation prototype and is no longer being produced. While being tested at the WSTC, the Windstream 25 was still in a developmental stage, and operational problems were experienced during its testing period. It is important to underscore, however, that problems encountered during testing of the machine created valuable gains in experience and data for both Rocky Flats and Grumman personnel. It is believed these gains have contributed significantly to further development of Grumman WTG's.

  8. Gas Generation Testing of Neptunium Oxide at Elevated Temperature

    SciTech Connect

    Duffey, JM

    2004-01-30

    Elevated temperature gas generation tests have been conducted using neptunium dioxide produced on a laboratory scale using the HB-Line Phase II flowsheet. These tests were performed to determine what effect elevated temperatures would have on the neptunium dioxide in comparison to neptunium dioxide tested at ambient temperature. The headspace gas compositions following storage at elevated temperatures associated with normal conditions of transport (NCT) have been measured. These test results show an increase in hydrogen generation rate at elevated temperature and significant removal of oxygen from the headspace gas. The elevated temperature gas generation tests described in this report involved heating small test vessels containing neptunium dioxide and measuring the headspace gas pressure and composition at the end of the test period. Four samples were used in these tests to evaluate the impact of process variables on the gas generation rate. Two samples were calcined to 600 degrees Celsius and two were calcined to 650 degrees Celsius. Each test vessel contained approximately 9.5 g of neptunium dioxide. Following exposure to 75 per cent relative humidity (RH) for five days, these samples were loaded in air and then heated to between 105 and 115 degrees Celsius for about one month. At the conclusion of the test period, the headspace gas of each container was analyzed using a micro-gas chromatograph installed in the glovebox where the experiments were conducted. The pressure, volume, and composition data for the headspace gas samples were used to calculate average H2 generation rates.

  9. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 40 Protection of Environment 6 2012-07-01 2012-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent. The...

  10. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 40 Protection of Environment 5 2011-07-01 2011-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent. The...

  11. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 40 Protection of Environment 6 2013-07-01 2013-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent. The...

  12. 40 CFR 53.42 - Generation of test atmospheres for wind tunnel tests.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 40 Protection of Environment 6 2014-07-01 2014-07-01 false Generation of test atmospheres for wind... Testing Performance Characteristics of Methods for PM 10 § 53.42 Generation of test atmospheres for wind... of multiplets (doublets and triplets) in a test particle atmosphere shall not exceed 10 percent. The...

  13. Endogenous rhythm and pattern-generating circuit interactions in cockroach motor centres

    PubMed Central

    David, Izhak; Holmes, Philip

    2016-01-01

    ABSTRACT Cockroaches are rapid and stable runners whose gaits emerge from the intricate, and not fully resolved, interplay between endogenous oscillatory pattern-generating networks and sensory feedback that shapes their rhythmic output. Here we studied the endogenous motor output of a brainless, deafferented preparation. We monitored the pilocarpine-induced rhythmic activity of levator and depressor motor neurons in the mesothoracic and metathoracic segments in order to reveal the oscillatory networks’ architecture and interactions. Data analyses included phase relations, latencies between and overlaps of rhythmic bursts, spike frequencies, and the dependence of these parameters on cycle frequency. We found that, overall, ipsilateral connections are stronger than contralateral ones. Our findings revealed asymmetries in connectivity among the different ganglia, in which meta-to-mesothoracic ascending coupling is stronger than meso-to-metathoracic descending coupling. Within-ganglion coupling between the metathoracic hemiganglia is stronger than that in the mesothoracic ganglion. We also report differences in the role and mode of operation of homologue network units (manifested by levator and depressor nerve activity). Many observed characteristics are similar to those exhibited by intact animals, suggesting a dominant role for feedforward control in cockroach locomotion. Based on these data we posit a connectivity scheme among components of the locomotion pattern generating system. PMID:27422902

  14. A circuit-level model of hippocampal place field dynamics modulated by entorhinal grid and suppression-generating cells.

    PubMed

    Jayet Bray, Laurence C; Quoy, Mathias; Harris, Frederick C; Goodman, Philip H

    2010-01-01

    Hippocampal "place cells" and the precession of their extracellularly recorded spiking during traversal of a "place field" are well-established phenomena. More recent experiments describe associated entorhinal "grid cell" firing, but to date only conceptual models have been offered to explain the potential interactions among entorhinal cortex (EC) and hippocampus. To better understand not only spatial navigation, but mechanisms of episodic and semantic memory consolidation and reconsolidation, more detailed physiological models are needed to guide confirmatory experiments. Here, we report the results of a putative entorhinal-hippocampal circuit level model that incorporates recurrent asynchronous-irregular non-linear (RAIN) dynamics, in the context of recent in vivo findings showing specific intracellular-extracellular precession disparities and place field destabilization by entorhinal lesioning. In particular, during computer-simulated rodent maze navigation, our model demonstrate asymmetric ramp-like depolarization, increased theta power, and frequency (that can explain the phase precession disparity), and a role for STDP and K(AHP) channels. Additionally, we propose distinct roles for two entorhinal cell populations projecting to hippocampus. Grid cell populations transiently trigger place field activity, while tonic "suppression-generating cell" populations minimize aberrant place cell activation, and limit the number of active place cells during traversal of a given field. Applied to place-cell RAIN networks, this tonic suppression explains an otherwise seemingly discordant association with overall increased firing. The findings of this circuit level model suggest in vivo and in vitro experiments that could refute or support the proposed mechanisms of place cell dynamics and modulating influences of EC.

  15. Test Input Generation for Red-Black Trees using Abstraction

    NASA Technical Reports Server (NTRS)

    Visser, Willem; Pasareanu, Corina S.; Pelanek, Radek

    2005-01-01

    We consider the problem of test input generation for code that manipulates complex data structures. Test inputs are sequences of method calls from the data structure interface. We describe test input generation techniques that rely on state matching to avoid generation of redundant tests. Exhaustive techniques use explicit state model checking to explore all the possible test sequences up to predefined input sizes. Lossy techniques rely on abstraction mappings to compute and store abstract versions of the concrete states; they explore under-approximations of all the possible test sequences. We have implemented the techniques on top of the Java PathFinder model checker and we evaluate them using a Java implementation of red-black trees.

  16. More about hospital generator sizing, testing and exercising.

    PubMed

    Nash, H O

    1996-08-01

    The National Fire Protection Agency (NFPA) and the Joint Commission on Accreditation of Healthcare Organizations (JCAHO) requirements for testing and exercising on-site standby generators are intended to prevent testing with insufficient load. However, engineers grapple with local and state enforcement agencies who require needlessly oversized standby generators, putting the engineer in the difficult position of using supplementary load banks because of insufficient building load for testing. This document examines the latest changes in NFPA codes and the JCAHO policy that aim to resolve testing issues.

  17. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, David M.

    1996-01-01

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit.

  18. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, D.M.

    1996-11-05

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit. 5 figs.

  19. CFFF testing of ceramic elements for MHD generators

    SciTech Connect

    Lineberry, J.T.; Christiansen, P.J.

    1994-12-31

    In September 1992, the POC test LMF5-J was concluded at the CFFF in accordance with the objectives as set for the western coal POC test program. During this activity, a {open_quotes}piggyback{close_quotes} type test was conducted for the Busek Company in partial fulfillment of a DOE Phase II SBIR. A near prototypical design, generator module that was designed and constructed by the Busek Co. was installed in the LMF upstream test train of the CFFF for this test. The module incorporated AlN{sub 2} (ceramic) sidebar elements. The objective of the SBIR Phase II was to evaluate the integrity of this material subject to long duration operation under typical coal-fired MHD generator conditions. A summary of the LMF5-J test at the CFFF and activities and test results relevant to the SBIR Phase II related to the Busek SBIR project are provided.

  20. Development and Test of a Prototype 100MVA Superconducting Generator

    SciTech Connect

    Fogarty, James M.; Bray, James W.

    2007-05-25

    In 2002, General Electric and the US Department of Energy (DOE) entered into a cooperative agreement for the development of a commercialized 100 MVA generator using high temperature superconductors (HTS) in the field winding. The intent of the program was to: • Identify and develop technologies that would be needed for such a generator. • Develop conceptual designs for generators with ratings of 100 MVA and higher using HTS technology. • Perform proof of concept tests at the 1.5 MW level for GE’s proprietary warm iron rotor HTS generator concept. • Design, build, and test a prototype of a commercially viable 100 MVA generator that could be placed on the power grid. This report summarizes work performed during the program and is provided as one of the final program deliverables.

  1. Running Tests of a Combined SC Type Linear Generator

    NASA Astrophysics Data System (ADS)

    Hasegawa, Hitoshi; Murai, Toshiaki; Yamamoto, Takamitsu

    In the superconducting maglev system, it is important to develop a non-contact on-board power source without environmental pollution such as noise and exhaust gas. We have studied a combined SC (Superconducting Coil) type linear generator as the most realistic system. The linear generator system has improved to increase output, power factor and measuring equipment. In this paper, the linear generator system is experimented in running tests on the Yamanashi Test line. We can supply power of 25kW to half a car in the speed range 400km/h to 500km/h. A good correlation is recognized between the analysis and measurement in the running tests. This linear generator system can be expected to be applicable in the practical use

  2. Global optimization of digital circuits

    NASA Astrophysics Data System (ADS)

    Flandera, Richard

    1991-12-01

    This thesis was divided into two tasks. The first task involved developing a parser which could translate a behavioral specification in Very High-Speed Integrated Circuits (VHSIC) Hardware Description Language (VHDL) into the format used by an existing digital circuit optimization tool, Boolean Reasoning In Scheme (BORIS). Since this tool is written in Scheme, a dialect of Lisp, the parser was also written in Scheme. The parser was implemented is Artez's modification of Earley's Algorithm. Additionally, a VHDL tokenizer was implemented in Scheme and a portion of the VHDL grammar was converted into the format which the parser uses. The second task was the incorporation of intermediate functions into BORIS. The existing BORIS contains a recursive optimization system that optimizes digital circuits by using circuit outputs as inputs into other circuits. Intermediate functions provide a greater selection of functions to be used as circuits inputs. Using both intermediate functions and output functions, the costs of the circuits in the test set were reduced by 43 percent. This is a 10 percent reduction when compared to the existing recursive optimization system. Incorporating intermediate functions into BORIS required the development of an intermediate-function generator and a set of control methods to keep the computation time from increasing exponentially.

  3. A three-phase sag generator for testing industrial equipment

    SciTech Connect

    Collins, E.R. Jr.; Morgan, R.L.

    1996-01-01

    A diesel powered three-phase standby 480V, 15kW, 60Hz synchronous generator has been modified to give controlled three-phase voltage sags. These sags can be controlled in both depth and duration. A 486-based computer with a data acquisition system controls the generator and monitors the system under test. The custom software interface allows the user to select the depth and duration of the each sag. Typically, the user will select a series of sags in selectable increments down to a certain depth. The data acquisition system has both digital and analog inputs, so that data lines, ac and dc voltages and currents, contactors and relays, etc. can be monitored during the tests. The software interface enables the user to select allowable tolerance bands for the monitored signals. If one or more of the signals falls outside the allowable range, the test is suspended. The sag depth and duration that caused the equipment to fail the test is then recorded. After testing over a range of sag durations, a CBEMA-type curve is available for the system under test. The sag generator enables the user to systematically determine the sensitivity of the components of an installed process line. This will enable the user to determine cost-effective ride-through enhancement strategies or to test the effectiveness of currently installed equipment. Although this test generator is small, the basic concept can be scaled up to the 2MVA range.

  4. Once-through testing of the CRBRP prototype steam generator

    SciTech Connect

    Kim, K.; Gabler, M.J.; Carlson, R.D.

    1987-01-01

    The prototype steam generator for the Clinch River Breeder Reactor Plant (CRBRP) was designed, built, and tested by Rockwell International. A portion of these tests, performed by the Energy Technology Engineering Center during early 1983, had the specific objective of supporting the design of a hockey-stick-type steam generator for use in the once-through cycle mode, including demonstration of steady-state operation, startup and shutdown in a once-through mode, and stable operation at low power. Eighteen steady-state performance tests were performed at power levels from 33 to 70 MWt, which represented 20 to 42 percent full power per tube of a commercial design. Pretest predictions are compared with test results. Startup and shutdown operations under a full-liquid condition in the steam generator are described. Steam generator tube inlet orifices, removed during the CRBRP test program, were not replaced for these tests. Therefore, dynamic instability was encountered during certain tests, and the results are compared with the DYNAM code for predicting flow instability conditions. Sodium and steam temperature maldistributions cause by testing at off-design conditions for this unit are also discussed.

  5. A Test Generation Framework for Distributed Fault-Tolerant Algorithms

    NASA Technical Reports Server (NTRS)

    Goodloe, Alwyn; Bushnell, David; Miner, Paul; Pasareanu, Corina S.

    2009-01-01

    Heavyweight formal methods such as theorem proving have been successfully applied to the analysis of safety critical fault-tolerant systems. Typically, the models and proofs performed during such analysis do not inform the testing process of actual implementations. We propose a framework for generating test vectors from specifications written in the Prototype Verification System (PVS). The methodology uses a translator to produce a Java prototype from a PVS specification. Symbolic (Java) PathFinder is then employed to generate a collection of test cases. A small example is employed to illustrate how the framework can be used in practice.

  6. The RANLUX Generator:. Resonances in a Random Walk Test

    NASA Astrophysics Data System (ADS)

    Shchur, Lev N.; Butera, Paolo

    Using a recently proposed directed random walk test, we systematically investigate the popular random number generator RANLUX developed by Lüscher and implemented by James. We confirm the good quality of this generator with the recommended luxury level. At a smaller luxury level (for instance equal to 1) resonances are observed in the random walk test. We also find that the lagged Fibonacci and Subtract-with-Carry recipes exhibit similar failures in the random walk test. A revised analysis of the corresponding dynamical systems leads to the observation of resonances in the eigenvalues of Jacobi matrix.

  7. Testing random number generators for Monte Carlo applications.

    PubMed

    Sim, L H; Nitschke, K N

    1993-03-01

    Central to any system for modelling radiation transport phenomena using Monte Carlo techniques is the method by which pseudo random numbers are generated. This method is commonly referred to as the Random Number Generator (RNG). It is usually a computer implemented mathematical algorithm which produces a series of numbers uniformly distributed on the interval [0,1). If this series satisfies certain statistical tests for randomness, then for practical purposes the pseudo random numbers in the series can be considered to be random. Tests of this nature are important not only for new RNGs but also to test the implementation of known RNG algorithms in different computer environments. Six RNGs have been tested using six statistical tests and one visual test. The statistical tests are the moments, frequency (digit and number), serial, gap, and poker tests. The visual test is a simple two dimensional ordered pair display. In addition the RNGs have been tested in a specific Monte Carlo application. This type of test is often overlooked, however it is important that in addition to satisfactory performance in statistical tests, the RNG be able to perform effectively in the applications of interest. The RNGs tested here are based on a variety of algorithms, including multiplicative and linear congruential, lagged Fibonacci, and combination arithmetic and lagged Fibonacci. The effect of the Bays-Durham shuffling algorithm on the output of a known "bad" RNG has also been investigated.

  8. Automatic image generation by genetic algorithms for testing halftoning methods

    NASA Astrophysics Data System (ADS)

    Mantere, Timo J.; Alander, Jarmo T.

    2000-10-01

    Automatic test image generation by genetic algorithms is introduced in this work. In general the proposed method has potential in functional software testing. This study was done by joining two different projects: the first one concentrates on software test data generation by genetic algorithms and the second one studied digital halftoning for an ink jet marking machine also by genetic algorithm optimization. The object software halftones images with different image filters. The goal was to reveal, if genetic algorithm is able to generate images that re difficult for the object software to halftone, in other words to find if some prominent characteristics of the original image disappear or ghost images appear due to the halftoning process. The preliminary results showed that genetic algorithm is able to find images that are considerable changed when halftoned, and thus reveal potential problems with the halftoning method, i.e. essentially tests for errors in the halftoning software.

  9. Dynamic test input generation for multiple-fault isolation

    NASA Technical Reports Server (NTRS)

    Schaefer, Phil

    1990-01-01

    Recent work is Causal Reasoning has provided practical techniques for multiple fault diagnosis. These techniques provide a hypothesis/measurement diagnosis cycle. Using probabilistic methods, they choose the best measurements to make, then update fault hypotheses in response. For many applications such as computers and spacecraft, few measurement points may be accessible, or values may change quickly as the system under diagnosis operates. In these cases, a hypothesis/measurement cycle is insufficient. A technique is presented for a hypothesis/test-input/measurement diagnosis cycle. In contrast to generating tests a priori for determining device functionality, it dynamically generates tests in response to current knowledge about fault probabilities. It is shown how the mathematics previously used for measurement specification can be applied to the test input generation process. An example from an efficient implementation called Multi-Purpose Causal (MPC) is presented.

  10. Modeling a Printed Circuit Heat Exchanger with RELAP5-3D for the Next Generation Nuclear Plant

    SciTech Connect

    Not Available

    2010-12-01

    The main purpose of this report is to design a printed circuit heat exchanger (PCHE) for the Next Generation Nuclear Plant and carry out Loss of Coolant Accident (LOCA) simulation using RELAP5-3D. Helium was chosen as the coolant in the primary and secondary sides of the heat exchanger. The design of PCHE is critical for the LOCA simulations. For purposes of simplicity, a straight channel configuration was assumed. A parallel intermediate heat exchanger configuration was assumed for the RELAP5 model design. The RELAP5 modeling also required the semicircular channels in the heat exchanger to be mapped to rectangular channels. The initial RELAP5 run outputs steady state conditions which were then compared to the heat exchanger performance theory to ensure accurate design is being simulated. An exponential loss of pressure transient was simulated. This LOCA describes a loss of coolant pressure in the primary side over a 20 second time period. The results for the simulation indicate that heat is initially transferred from the primary loop to the secondary loop, but after the loss of pressure occurs, heat transfers from the secondary loop to the primary loop.

  11. Interface circuit using SMFE technique for an inductive kinetic generator operating as a frequency-up converter

    NASA Astrophysics Data System (ADS)

    Sanchez, D.; Jodka, E.; Hoffmann, D.; Manoli, Y.

    2013-12-01

    This paper presents a novel interface circuit for an inductive kinetic energy harvester, which is designed based on the SMFE (Synchronized Magnetic Flux Extraction) technique. The generator is designed to fit into a shoe sole to power a telemetric device. It operates as a frequency-up converter and possesses a small output series resistance, allowing the SMFE scheme to be applied as an energy harvesting enhancement technique. A prototype has been implemented and simulated using discrete components in order to demonstrate the SMFE concept and compare it with typical standard interfaces used (Full Bridge and Voltage doubler rectifiers). Compared to the standard schemes, the SMFE method is able to extract a considerably higher amount of energy for a wide range of output voltages. Assuming one walking step per second, the complete system could provide 18.8 mW output power using the SMFE interface, compared to 8 mW with the full bridge and 12.3 mW using the voltage doubler.

  12. Results of closed cycle MHD power generation test with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross sectional dimensions of the MHD channel in the NASA Lewis closed loop facility were reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 160,000 n/M2, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/M. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/M were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/M3 were obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those previously reported for the M = 0.2 channel.

  13. Results of closed cycle MHD power generation tests with a helium-cesium working fluid

    NASA Technical Reports Server (NTRS)

    Sovie, R. J.

    1977-01-01

    The cross-sectional dimensions of the MHD channel in the NASA Lewis closed loop facility have been reduced to 3.8 x 11.4 cm. Tests were run in this channel using a helium-cesium working fluid at stagnation pressures of 1.6 x 10 to the 5th N/sq m, stagnation temperatures of 2000-2060 K and an entrance Mach number of 0.36. In these tests Faraday open circuit voltages of 200 V were measured which correspond to a Faraday field of 1750 V/m. Power generation tests were run for different groups of electrode configurations and channel lengths. Hall fields up to 1450 V/m were generated. Power extraction per electrode of 183 W and power densities of 1.7 MW/cu m have been obtained. A total power output of 2 kW was generated for tests with 14 electrodes. The power densities obtained in this channel represent a factor of 3 improvement over those reported for the m = 0.2 channel at the last EAM Symposium.

  14. A 4 V, ns-range pulse generator for the test of Cherenkov Telescopes readout electronics

    NASA Astrophysics Data System (ADS)

    Antoranz, P.; Vegas, I.; Miranda, J. M.

    2010-08-01

    We present in this paper the design, fabrication and verification of a ns-range pulse generator based on a Step Recovery Diode (SRD). This device needs only a 5 V DC power supply, delivers 1 ns pulses with peak amplitudes in excess of 4 V and features state of the art jitter figures. In addition, the pulser contains a trigger channel. The long standing problem of the SRD simulation via circuital analysis is addressed. It is shown that the dynamic properties of the Step Recovery Diode can accurately be reproduced via a small signal circuital simulation for the rise times needed in a ns-range pulser. It is also demonstrated that strong inaccuracies in the pulse shape prediction are obtained if the wave propagation through the lines typically used in this type of circuits is simulated by a simple Transverse Electromagnetic Mode (TEM) line model. Instead, it is necessary to account for non-TEM effects. By means of broadband resistive power splitters and high dynamic range amplifiers, a prototype of 4 channels was also fabricated. This prototype is particularly useful for testing the readout electronics of Cherenkov Telescopes, but additional applications to other large-scale experiments are expected, any of those where calibration or verification with compact ns-range pulsers featuring low jitter, large dynamic ranges and multichannel operation is needed. In addition, the fabrication cost of this pulser is almost negligible as compared with bulky, commercially available waveform generators, which rarely deliver ns pulses in excess of 3 V. Furthermore, the small size of the pulser presented here and its low power consumption allow an easy integration into more complex systems.

  15. Group I, II, and III mGluR compounds affect rhythm generation in the gastric circuit of the crustacean stomatogastric ganglion.

    PubMed

    Krenz, W D; Nguyen, D; Pérez-Acevedo, N L; Selverston, A I

    2000-03-01

    We have studied the effects of group I, II, and III metabotropic glutamate receptor (mGluR) agonists on rhythm generation by the gastric circuit of the stomatogastric ganglion (STG) of the Caribbean spiny lobster Panulirus argus. All mGluR agonists and some antagonists we tested in this study had clear and distinct effects on gastric rhythm generation when superfused over combined oscillating or blocked silent STG preparations. A consistent difference between group I agonists and group II and III agonists was that group I agonists acted excitatory. The group I-specific agonists L-quisqualic acid and (S)-3,5-dihydroxyphenylglycine, as well as the nonspecific agonist (1S,3R)-1-aminocyclopentane-1, 3-dicarboxylic acid accelerated ongoing rhythms and could induce gastric rhythms in silent preparations. The group II agonist (2S,1'S, 2'S)-2-(carboxycyclopropyl)glycine (L-CCG-I) and the group III agonist L(+)-2-amino-4-phosphonobutyric acid (L-AP4) slowed down or completely blocked ongoing gastric rhythms and were without detectable effect on silent preparations. The action of L-CCG-I was blocked partially by the group-II-specific antagonist, (RS)-1-amino-5-phosphonoindan-1-carboxylic acid [(RS)APICA], and the group-III-specific antagonist (RS)-alpha-methyl-4-phosphonophenylglycine completely blocked the action of L-AP4. Besides its antagonistic action, the group-II-specific antagonist (RS)APICA had a remarkably strong apparent inverse agonist action when applied alone on oscillating preparations. The action of all drugs was dose dependent and reversible, although recovery was not always complete. In our experiments, the effects of none of the mGluR-specific agonists were antagonized or amplified by the N-methyl-D-aspartate (NMDA)-receptor-specific antagonist D(-)-2-amino-5-phosphonopentanoic acid, excluding the contamination of responses to mGluR agonists by nonspecific cross-reactivity with NMDA receptors. Picrotoxin did not prevent the inhibitory action of L-CCG-I and

  16. Ion beam induced charge collection (IBICC) from integrated circuit test structures using a 10 MeV carbon microbeam

    SciTech Connect

    Guo, B. N.; El Bouanani, M.; Duggan, J. L.; McDaniel, F. D.; Renfrow, S. N.; Doyle, B. L.; Walsh, D. S.; Aton, T. J.

    1999-06-10

    As feature sizes of Integrated Circuits (ICs) continue to shrink, the sensitivity of these devices, particularly SRAMs and DRAMs, to natural radiation is increasing. In this paper, the Ion Beam Induced Charge Collection (IBICC) technique is utilized to simulate neutron-induced Si recoil effects in ICs. The IBICC measurements, conducted at the Sandia National Laboratories, employed a 10 MeV carbon microbeam with 1{mu}m diameter spot to scan test structures on specifically designed ICs. With the aid of IC layout information, an analysis of the charge collection efficiency from different test areas is presented.

  17. a Measurement Circuit to Test Bell's Inequalities in a Oscopic Superconducting Device

    NASA Astrophysics Data System (ADS)

    Tesche, C. D.

    A measurement circuit for the flux state of an rf SQUID is described which has elements analogous to those used in a conventional EPR experiment. These elements include dc SQUID switches which act like polarizers, and dissipative dc SQUID magnetometers which act like particle detectors. These elements can be used in an experimental search for violations of orealism and non-invasive measurability in a oscopic system.

  18. The Hoff circuit test is more specific than an incremental treadmill test to assess endurance with the ball in youth soccer players.

    PubMed

    Zagatto, A M; Papoti, M; Da Silva, Asr; Barbieri, R A; Campos, E Z; Ferreira, E C; Loures, J P; Chamari, K

    2016-09-01

    The assessment of aerobic endurance is important for training prescription in soccer, and is usually measured by straight running without the ball on a track or treadmill. Due to the ball control and technical demands during a specific soccer test, the running speeds are likely to be lower compared to a continuous incremental test. The aim of the present study was to compare the heart rate (HR), rating of perceived exertion (RPE) and speeds corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1), lactate threshold (Dmax method) and peak lactate determined in the laboratory and in the Hoff circuit soccer-specific test. Sixteen soccer players (16±1 years) underwent two incremental tests (laboratory and Hoff circuit tests). The speeds were significantly higher in the treadmill test than on the Hoff circuit (2.0 mmol∙L(-1): 9.5±1.2 and 8.1±1.0 km∙h(-1); 3.5 mmol∙L(-1): 12.0±1.2 and 10.2±1.1 km∙h(-1); Dmax: 11.4±1.4 and 9.3±0.4 km∙h(-1); peak lactate: 14.9±1.6 and 10.9±0.8 km∙h(-1)). The HR corresponding to 3.5 mmol∙L-1 was significantly higher on the Hoff circuit compared to the laboratory test (187.5±18.0 and 178.2±17.6 bpm, respectively; P <0.001), while the RPE at the last incremental stage was lower on the Hoff circuit (P < 0.01). The speeds during the Hoff specific soccer test and the HR corresponding to 2.0 mmol∙L(-1), 3.5 mmol∙L(-1) and Dmax/threshold were different compared with the laboratory test. The present study shows that it is possible to assess submaximal endurance related variables specifically in soccer players.

  19. Gas Generation from K East Basin Sludges - Series II Testing

    SciTech Connect

    Bryan, Samuel A.; Delegard, Calvin H.; Schmidt, Andrew J.; Sell, Rachel L.; Silvers, Kurt L.; Gano, Susan R.; Thornton, Brenda M.

    2001-03-14

    This report describes work to examine the gas generation behavior of actual K East (KE) Basin floor, pit and canister sludge. Mixed and unmixed and fractionated KE canister sludge were tested, along with floor and pit sludges from areas in the KE Basin not previously sampled. The first report in this series focused on gas generation from KE floor and canister sludge collected using a consolidated sampling technique. The third report will present results of gas generation testing of irradiated uranium fuel fragments with and without sludge addition. The path forward for management of the K Basin Sludge is to retrieve, ship, and store the sludge at T Plant until final processing at some future date. Gas generation will impact the designs and costs of systems associated with retrieval, transportation and storage of sludge.

  20. Automated Generation and Assessment of Autonomous Systems Test Cases

    NASA Technical Reports Server (NTRS)

    Barltrop, Kevin J.; Friberg, Kenneth H.; Horvath, Gregory A.

    2008-01-01

    This slide presentation reviews some of the issues concerning verification and validation testing of autonomous spacecraft routinely culminates in the exploration of anomalous or faulted mission-like scenarios using the work involved during the Dawn mission's tests as examples. Prioritizing which scenarios to develop usually comes down to focusing on the most vulnerable areas and ensuring the best return on investment of test time. Rules-of-thumb strategies often come into play, such as injecting applicable anomalies prior to, during, and after system state changes; or, creating cases that ensure good safety-net algorithm coverage. Although experience and judgment in test selection can lead to high levels of confidence about the majority of a system's autonomy, it's likely that important test cases are overlooked. One method to fill in potential test coverage gaps is to automatically generate and execute test cases using algorithms that ensure desirable properties about the coverage. For example, generate cases for all possible fault monitors, and across all state change boundaries. Of course, the scope of coverage is determined by the test environment capabilities, where a faster-than-real-time, high-fidelity, software-only simulation would allow the broadest coverage. Even real-time systems that can be replicated and run in parallel, and that have reliable set-up and operations features provide an excellent resource for automated testing. Making detailed predictions for the outcome of such tests can be difficult, and when algorithmic means are employed to produce hundreds or even thousands of cases, generating predicts individually is impractical, and generating predicts with tools requires executable models of the design and environment that themselves require a complete test program. Therefore, evaluating the results of large number of mission scenario tests poses special challenges. A good approach to address this problem is to automatically score the results

  1. Islanding tests near a mini hydro generating plant

    SciTech Connect

    Jutras, R.; Lafond, C.; Srinivasan, K.; Plamondon, M.; Proulx, S.

    1995-12-31

    In this paper, the authors present the measurements taken while a mini hydro power plant and the adjoining load were islanded on a 25 kV distribution feeder. This was as a part of the acceptance tests before commissioning. The frequency was allowed to vary from 56.3 to 64.5 Hz before the generation was tripped off. They also present the estimation of the moment of inertia of the generating system from these measurements.

  2. Thrombin generation testing for monitoring hemophilia treatment: a clinical perspective.

    PubMed

    Salvagno, Gian Luca; Berntorp, Erik

    2010-10-01

    Thrombin generation is a key process that determines the extent of a hemostatic plug or a thrombotic process. The ensuing thrombin burst is crucial for the formation of a stable fibrin clot. During its active life, thrombin exerts a multitude of highly regulated actions on the blood and the vessel wall, among which is the clotting of fibrinogen. The inappropriate generation of thrombin may lead to pathological processes, foremost of which are hemorrhagic or thrombotic diseases. The coagulation system is usually investigated by means of two in vitro classical clotting tests, the activated partial thromboplastin time and prothrombin time. These assays assess only the time taken to form a clot and do not entirely reflect global hemostatic balance. They permit identification of connectivity between the component activities identified as required for plasma coagulation and define the concept of intrinsic and extrinsic coagulation pathways, which converge at the step of formation of the prothrombinase complex. However, the mechanisms established by in vitro tests are not always mirrored in the human pathologies associated with bleeding or thrombosis. The recent development of newer tests based on the continuous registration of thrombin generation (TG) under in vitro conditions that mimic more closely what occurs in vivo prompted us to reinvestigate the balance between procoagulants and anticoagulants in patients. Thrombin generation assays (TGA) not only provide an overall assessment of hemostasis, but they also target potential extrahemostatic effects of the generated thrombin, a potent agonist of a multitude of cellular activation pathways. Moreover, estimation of an individual's thrombin generation potential may correlate more closely with a hyper- or hypocoagulable phenotype, compared with traditional coagulation tests. In this review, we discuss to what extent TG can be expected to reflect the clotting function of blood, the development and use of different TGA

  3. Conditioning of pretreated LLW generated by the decontamination of VVR-S nuclear research reactor primary circuit

    SciTech Connect

    Nicu, Mihaela I.; Ionascu, Laura A.; Dragolici, Felicia N.; Turcanu, Corneliu N.; Rotarescu, Gheorghe Gh.; Dogaru, Gheorghe C.

    2013-07-01

    Concentration of complexing acids solutions (oxalic acid, tartaric acid and citric acid) used in radioactive decontamination by chemical method affects both the mechanical stability and the chemical stability of cement matrix. The paper presents the works performed related to the chemical pretreatment of these organic acids solutions using as neutralizing agent Ca(OH){sub 2}. In this way it was possible to increase the concentration of organic acids solutions used and the soluble complex radionuclides passing in chemical precipitates, these affecting in a smaller manner the mechanical stability of the cement matrix. The chemical pretreatment the effluents improve the precipitation and conditioning performances by cementation. Were prepared compositions with complexing agents and compositions for oxidative degradation tests to simulate the concentrations of secondary radioactive waste obtained from the primary circuit decontamination of the VVR-S research reactor. It has been studied the influence of chemical pretreatment of complexing acids solutions of different concentrations on the setting time. Also it was determined the compressive strength of mortar samples in which were embedded these solutions of chemically pretreated organic acids. The results shown that an optimum cement - solution ratio doesn't have a significant impact on the setting time or on the mechanical properties. (authors)

  4. Design and use of a computerized test generating program

    NASA Astrophysics Data System (ADS)

    Schaefer, Edward; Marschall, Laurence A.

    1980-07-01

    An easy-to-use set of programs for the computerized generation of multiple-choice and essay examinations in an introductory astronomy course is described. The programs allow the user to establish files of test questions and to rapidly assemble printed copies of examinations suitable for photocopying. Written in ALGOL for a Burroughs B6700 computer, the programs can, in principle, be implemented on large mainframe computers or on microcomputers of a size increasingly available to physics departments. The advantages and costs of computerized test generation are discussed.

  5. Hidden circuits and argumentation

    NASA Astrophysics Data System (ADS)

    Leinonen, Risto; Kesonen, Mikko H. P.; Hirvonen, Pekka E.

    2016-11-01

    Despite the relevance of DC circuits in everyday life and schools, they have been shown to cause numerous learning difficulties at various school levels. In the course of this article, we present a flexible method for teaching DC circuits at lower secondary level. The method is labelled as hidden circuits, and the essential idea underlying hidden circuits is in hiding the actual wiring of DC circuits, but to make their behaviour evident for pupils. Pupils are expected to find out the wiring of the circuit which should enhance their learning of DC circuits. We present two possible ways to utilise hidden circuits in a classroom. First, they can be used to test and enhance pupils’ conceptual understanding when pupils are expected to find out which one of the offered circuit diagram options corresponds to the actual circuit shown. This method aims to get pupils to evaluate the circuits holistically rather than locally, and as a part of that aim this method highlights any learning difficulties of pupils. Second, hidden circuits can be used to enhance pupils’ argumentation skills with the aid of argumentation sheet that illustrates the main elements of an argument. Based on the findings from our co-operating teachers and our own experiences, hidden circuits offer a flexible and motivating way to supplement teaching of DC circuits.

  6. Advances in synthetic dynamic circuits design: using novel synthetic parts to engineer new generations of gene oscillations.

    PubMed

    Sowa, Steven William; Gelderman, Grant; Contreras, Lydia Maria

    2015-12-01

    As bioengineering applications expand, the need to design and implement circuits that exhibit dynamic properties increases. In particular, schemes that control precise patterns of gene expression as a function of time are essential for balancing multiple metabolic objectives in natural and synthetic systems. Given that modularity has been an important component of dynamic circuits, recent efforts to improve dynamic circuits have focused on replacing old parts for new components that increase the robustness, stability, and tunability. In this review, we show that incorporation of novel components such as regulatory noncoding RNAs (ncRNAs), promoter-transcription factor pairs, and metabolite sensors have allowed traditional dynamic circuits to obtain more robust functionality and improved dynamic properties.

  7. Next Generation Advanced Video Guidance Sensor Development and Test

    NASA Technical Reports Server (NTRS)

    Howard, Richard T.; Bryan, Thomas C.; Lee, Jimmy; Robertson, Bryan

    2009-01-01

    The Advanced Video Guidance Sensor (AVGS) was the primary docking sensor for the Orbital Express mission. The sensor performed extremely well during the mission, and the technology has been proven on orbit in other flights too. Parts obsolescence issues prevented the construction of more AVGS units, so the next generation of sensor was designed with current parts and updated to support future programs. The Next Generation Advanced Video Guidance Sensor (NGAVGS) has been tested as a breadboard, two different brassboard units, and a prototype. The testing revealed further improvements that could be made and demonstrated capability beyond that ever demonstrated by the sensor on orbit. This paper presents some of the sensor history, parts obsolescence issues, radiation concerns, and software improvements to the NGAVGS. In addition, some of the testing and test results are presented. The NGAVGS has shown that it will meet the general requirements for any space proximity operations or docking need.

  8. Experiments with Test Case Generation and Runtime Analysis

    NASA Technical Reports Server (NTRS)

    Artho, Cyrille; Drusinsky, Doron; Goldberg, Allen; Havelund, Klaus; Lowry, Mike; Pasareanu, Corina; Rosu, Grigore; Visser, Willem; Koga, Dennis (Technical Monitor)

    2003-01-01

    Software testing is typically an ad hoc process where human testers manually write many test inputs and expected test results, perhaps automating their execution in a regression suite. This process is cumbersome and costly. This paper reports preliminary results on an approach to further automate this process. The approach consists of combining automated test case generation based on systematically exploring the program's input domain, with runtime analysis, where execution traces are monitored and verified against temporal logic specifications, or analyzed using advanced algorithms for detecting concurrency errors such as data races and deadlocks. The approach suggests to generate specifications dynamically per input instance rather than statically once-and-for-all. The paper describes experiments with variants of this approach in the context of two examples, a planetary rover controller and a space craft fault protection system.

  9. Thermal eddy current testing of metallization quality of printed circuit boards (PCB)

    NASA Astrophysics Data System (ADS)

    Savushkin, D. G.; Polyahov, M. Y.; Chernov, L. A.

    2000-05-01

    Today the fissile thermal control methods are used often enough to evaluate the metallization quality of printed circuit boards. However, it is necessary to note that the existing difficulties while exciting a non-steady thermal wave. There was offered the thermal input, which allows us to supply heat through the upper edge of a metallizing tube and to register parameters of thermal disturbance from the opposite side. The thermal input represents a hollow metal cone where the thermal disturbance is suggested to be effectuated by eddy currents induced by a coil situated above the thermal input. The agitating current is a kind of radio pulse with a high frequency filling. The field frequency, thickness and the electromagnetic characteristics of the thermal input were selected so that the field couldn't propagate into space beneath the thermal input. It is possible to evaluate some parameters of the metallizing tube registering from the other side of the printed circuit board the thermal disturbance parameters (e.g. the arrival time of maximum and amplitude). The numerical calculations were made with a specially developed software with the purpose of obtaining the dependence of the arrival time of maximum and the thermal disturbance amplitude upon a printed circuit board metallization layer, the hole diameter, the board thickness, the metallization tube conductivity, the contact pad diameter. The heat exchange with the board material was not taken into account when making calculations because the thermal disturbance propagation time along the metallization tube is too short and this assumption does not make a considerable error.

  10. Optoelectronic cross-injection locking of a dual-wavelength photonic integrated circuit for low-phase-noise millimeter-wave generation.

    PubMed

    Kervella, Gaël; Van Dijk, Frederic; Pillet, Grégoire; Lamponi, Marco; Chtioui, Mourad; Morvan, Loïc; Alouini, Mehdi

    2015-08-01

    We report on the stabilization of a 90-GHz millimeter-wave signal generated from a fully integrated photonic circuit. The chip consists of two DFB single-mode lasers whose optical signals are combined on a fast photodiode to generate a largely tunable heterodyne beat note. We generate an optical comb from each laser with a microwave synthesizer, and by self-injecting the resulting signal, we mutually correlate the phase noise of each DFB and stabilize the beatnote on a multiple of the frequency delivered by the synthesizer. The performances achieved beat note linewidth below 30 Hz.

  11. Mitochondrial ion circuits.

    PubMed

    Nicholls, David G

    2010-01-01

    Proton circuits across the inner mitochondrial membrane link the primary energy generators, namely the complexes of the electron transport chain, to multiple energy utilizing processes, including the ATP synthase, inherent proton leak pathways, metabolite transport and linked circuits of sodium and calcium. These mitochondrial circuits can be monitored in both isolated preparations and intact cells and, for the primary proton circuit techniques, exist to follow both the proton current and proton electrochemical potential components of the circuit in parallel experiments, providing a quantitative means of assessing mitochondrial function and, equally importantly, dysfunction.

  12. Benzene Generation Testing for Tank 48H Waste Disposition

    SciTech Connect

    Peters, T

    2005-05-13

    In support for the Aggregation option1, researchers performed a series of tests using actual Tank 48H slurries. The tests were designed to examine potential benzene generation issues if the Tank 48H slurry is disposed to Saltstone. Personnel used the archived Tank 48H sample (HTF-E-03-127, collected September 17, 2003) for the experiments. The tests included a series of three experiments (Tests A, B, and F) performed in duplicate, giving a total of six experiments. Test A used Tank 48H slurry mixed with {approx}20:1 with Defense Waste Processing Facility (DWPF) Recycle from Tanks 21H and 22H. Test B used Tank 48H slurry mixed with {approx}2.7:1 with DWPF Recycle from Tanks 21H and 22H, while Test F used Tank 48H slurry as-is. Tests A and B occurred at 45 C, while Test F occurred at 55 C. Over a period of 8 weeks, personnel collected samples for analysis, once per week. Each sample was tested with the in-cell gamma counter. The researchers noted a decline in the cesium activity in solution which is attributed to temperature dependence of the complex slurry equilibrium. Selected samples were sent to ADS for potassium, boron, and cesium analysis. The benzene generation rate was inferred from the TPB destruction which is indirectly measured by the in-growth of cesium, potassium or boron. The results of all the analyses reveal no discernible in-growth of radiocesium, potassium or boron, indicating no significant tetraphenylborate (TPB) decomposition in any of the experiments. From boron measurements, the inferred rate of TPB destruction remained less than 0.332 mg/(L-h) implying a maximum benzene generation rate of <0.325 mg/(L-h).

  13. In Silico Proficiency Testing for Clinical Next-Generation Sequencing.

    PubMed

    Duncavage, Eric J; Abel, Haley J; Pfeifer, John D

    2017-01-01

    Quality assurance for clinical next-generation sequencing (NGS)-based assays is difficult given the complex methods and the range of sequence variants such assays can detect. As the number and range of mutations detected by clinical NGS assays has increased, it is difficult to apply standard analyte-specific proficiency testing (PT). Most current proficiency testing challenges for NGS are methods-based PT surveys that use DNA from reference samples engineered to harbor specific mutations that test both sequence generation and bioinformatics analysis. These methods-based PTs are limited by the number and types of mutations that can be physically introduced into a single DNA sample. In silico proficiency testing, which evaluates only the bioinformatics component of NGS assays, is a recently introduced PT method that allows for evaluation of numerous mutations spanning a range of variant classes. In silico PT data sets can be generated from simulated or actual sequencing data and are used to test alignment through variant detection and annotation steps. In silico PT has several advantages over the use of physical samples, including greater flexibility in tested variants, the ability to design laboratory-specific challenges, and lower costs. Herein, we review the use of in silico PT as an alternative to traditional methods-based PT as it is evolving in oncology applications and discuss how the approach is applicable more broadly.

  14. Molten-Caustic-Leaching (Gravimelt) System Integration Project, Phase 2. Topical report for test circuit maintenance, refurbishment, modification, and off-line operation

    SciTech Connect

    Not Available

    1993-03-01

    This is a report of the maintenance, refurbishment, modifications, and off-line circuit component testing of the integrated test circuit of the Molten-Caustic-Leaching (MCL or Gravimelt) process for the desulfurization and demineralization of coal. The project is sponsored by the Pittsburgh Energy Technology Center of the US Department of Energy under Contract No. DE-AC22-86-PC91257.

  15. Automatic Generation of Tests from Domain and Multimedia Ontologies

    ERIC Educational Resources Information Center

    Papasalouros, Andreas; Kotis, Konstantinos; Kanaris, Konstantinos

    2011-01-01

    The aim of this article is to present an approach for generating tests in an automatic way. Although other methods have been already reported in the literature, the proposed approach is based on ontologies, representing both domain and multimedia knowledge. The article also reports on a prototype implementation of this approach, which…

  16. The Effects of Student-Generated Questions on Test Performance.

    ERIC Educational Resources Information Center

    Reeves-Kazelskis, Carolyn; Kazelskis, Richard

    A total of 50 college students enrolled in different sections of a language arts methodology course served as treatment and control groups to investigate the effects of student-generated questions on test performance. Periodically throughout the course, students in the treatment group received instruction in effective questioning techniques by…

  17. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2014 CFR

    2014-04-01

    ... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages § 864.7900...

  18. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2012 CFR

    2012-04-01

    ... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages § 864.7900...

  19. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2011 CFR

    2011-04-01

    ... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages § 864.7900...

  20. 21 CFR 864.7900 - Thromboplastin generation test.

    Code of Federal Regulations, 2013 CFR

    2013-04-01

    ... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Thromboplastin generation test. 864.7900 Section 864.7900 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES HEMATOLOGY AND PATHOLOGY DEVICES Hematology Kits and Packages § 864.7900...