49 CFR 236.342 - Switch circuit controller.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Switch circuit controller. 236.342 Section 236.342... Instructions § 236.342 Switch circuit controller. Switch circuit controller connected at the point to switch... corresponding to switch point closure when switch point is open one-fourth inch or more. Inspection and Tests ...

49 CFR 236.342 - Switch circuit controller.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Switch circuit controller. 236.342 Section 236.342... Instructions § 236.342 Switch circuit controller. Switch circuit controller connected at the point to switch... corresponding to switch point closure when switch point is open one-fourth inch or more. Inspection and Tests ...

49 CFR 236.342 - Switch circuit controller.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Switch circuit controller. 236.342 Section 236.342... Instructions § 236.342 Switch circuit controller. Switch circuit controller connected at the point to switch... corresponding to switch point closure when switch point is open one-fourth inch or more. Inspection and Tests ...

49 CFR 236.342 - Switch circuit controller.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Switch circuit controller. 236.342 Section 236.342... Instructions § 236.342 Switch circuit controller. Switch circuit controller connected at the point to switch... corresponding to switch point closure when switch point is open one-fourth inch or more. Inspection and Tests ...

Initial Testing of the Stainless Steel NaK-Cooled Circuit (SNaKC)

NASA Technical Reports Server (NTRS)

Garber, Anne; Godfroy, Thomas

2007-01-01

An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK) was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around the 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. This presentation addresses the construction, fill and initial testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

Radiation Testing and Evaluation Issues for Modern Integrated Circuits

NASA Technical Reports Server (NTRS)

LaBel, Kenneth A.; Cohn, Lew M.

2005-01-01

Abstract. Changes in modern integrated circuit (IC) technologies have modified the way we approach and conduct radiation tolerance and testing of electronics. These changes include scaling of geometries, new materials, new packaging technologies, and overall speed and device complexity challenges. In this short course section, we will identify and discuss these issues as they impact radiation testing, modeling, and effects mitigation of modern integrated circuits. The focus will be on CMOS-based technologies, however, other high performance technologies will be discussed where appropriate. The effects of concern will be: Single-Event Effects (SEE) and steady state total ionizing dose (TID) IC response. However, due to the growing use of opto-electronics in space systems issues concerning displacement damage testing will also be considered. This short course section is not intended to provide detailed "how-to-test" information, but simply provide a snapshot of current challenges and some of the approaches being considered.

Sources, paths, and concepts for reduction of noise in the test section of the NASA Langley 4x7m wind tunnel

NASA Technical Reports Server (NTRS)

Hayden, R. E.; Wilby, J. F.

1984-01-01

NASA is investigating the feasibility of modifying the 4x7m Wind Tunnel at the Langley Research Center to make it suitable for a variety of aeroacoustic testing applications, most notably model helicopter rotors. The amount of noise reduction required to meet NASA's goal for test section background noise was determined, the predominant sources and paths causing the background noise were quantified, and trade-off studies between schemes to reduce fan noise at the source and those to attenuate the sound generated in the circuit between the sources and the test section were carried out. An extensive data base is also presented on circuit sources and paths.

49 CFR 234.237 - Reverse switch cut-out circuit.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Reverse switch cut-out circuit. 234.237 Section... Maintenance, Inspection, and Testing Maintenance Standards § 234.237 Reverse switch cut-out circuit. A switch... system circuitry, shall be maintained so that the warning system can only be cut out when the switch...

49 CFR 234.237 - Reverse switch cut-out circuit.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Reverse switch cut-out circuit. 234.237 Section... Maintenance, Inspection, and Testing Maintenance Standards § 234.237 Reverse switch cut-out circuit. A switch... system circuitry, shall be maintained so that the warning system can only be cut out when the switch...

49 CFR 236.107 - Ground tests.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Ground tests. 236.107 Section 236.107...: All Systems Inspections and Tests; All Systems § 236.107 Ground tests. (a) Except as provided in paragraph (b) of this section, a test for grounds on each energy bus furnishing power to circuits, the...

49 CFR 236.107 - Ground tests.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Ground tests. 236.107 Section 236.107...: All Systems Inspections and Tests; All Systems § 236.107 Ground tests. (a) Except as provided in paragraph (b) of this section, a test for grounds on each energy bus furnishing power to circuits, the...

Testing Procedures for Open Circuit Air Diving H ELMETS AND Semi-Closed Circuit Mixed Gas Diving Helmets

DTIC Science & Technology

1973-12-18

abosrbent canister under all of the conditions in which the helmet will be expected to operate. These tests are very similar to those of Section III. B. 4... abosrbent canister will be operating but on air). Since the CO2 absorbent canister is not operating, it need not be instrumented. b. Recommended Tests -W 1

Lithium Circuit Test Section Design and Fabrication

NASA Technical Reports Server (NTRS)

Godfroy, Thomas; Garber, Anne

2006-01-01

The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper will discuss the overall system design and build and the component testing findings.

Lithium Circuit Test Section Design and Fabrication

NASA Astrophysics Data System (ADS)

Godfroy, Thomas; Garber, Anne; Martin, James

2006-01-01

The Early Flight Fission - Test Facilities (EFF-TF) team has designed and built an actively pumped lithium flow circuit. Modifications were made to a circuit originally designed for NaK to enable the use of lithium that included application specific instrumentation and hardware. Component scale freeze/thaw tests were conducted to both gain experience with handling and behavior of lithium in solid and liquid form and to supply anchor data for a Generalized Fluid System Simulation Program (GFSSP) model that was modified to include the physics for freeze/thaw transitions. Void formation was investigated. The basic circuit components include: reactor segment, lithium to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. This paper discusses the overall system design and build and the component testing findings.

Modifications to the Fission Surface Power Primary Test Circuit (FSP-PTC)

NASA Technical Reports Server (NTRS)

Garber, Anne E.

2008-01-01

An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of a closeable orifice in the test section. Modifications are now complete and testing has resumed. Performance of the ALIp, provided by Idaho National Laboratory (INL), is the subject of the first round ofexperimentation. This paper provides a summary of the tests conducted on the original circuit, details the physical changes that have since been made to it, and describes the current test program.

Investigations of detail design issues for the high speed acoustic wind tunnel using a 60th scale model tunnel. Part 2: Tests with the closed circuit

NASA Technical Reports Server (NTRS)

Barna, P. Stephen

1991-01-01

This report summarizes the tests on the 1:60 scale model of the High Speed Acoustic Wind Tunnel (HSAWT) performed during the period June - August 1991. Throughout the testing the tunnel was operated in the 'closed circuit mode,' that is when the airflow was set up by an axial flow fan, which was located inside the tunnel circuit and was directly driven by a motor. The tests were first performed with the closed test section and were subsequently repeated with the open test section, the latter operating with the nozzle-diffuser at its optimum setting. On this subject, reference is made to the report (1) issued January 1991, under contract 17-GFY900125, which summarizes the result obtained with the tunnel operating in the 'open circuit mode.' The tests confirmed the viability of the tunnel design, and the flow distributions in most of the tunnel components were considered acceptable. There were found, however, some locations where the flow distribution requires improvement. This applies to the flow upstream of the fan where the flow was found skewed, thus affecting the flow downstream. As a result of this, the flow appeared separated at the end of the large diffuser at the outer side. All tests were performed at NASA LaRC.

Documentation of Stainless Steel Lithium Circuit Test Section Design. Suppl

NASA Technical Reports Server (NTRS)

Godfroy, Thomas J. (Compiler); Martin, James J.

2010-01-01

The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations

Documentation of Stainless Steel Lithium Circuit Test Section Design

NASA Technical Reports Server (NTRS)

Godfroy, T. J.; Martin, J. J.; Stewart, E. T.; Rhys, N. O.

2010-01-01

The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.

Multi-channel detector readout method and integrated circuit

DOEpatents

Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

2006-12-12

An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

Multi-channel detector readout method and integrated circuit

DOEpatents

Moses, William W.; Beuville, Eric; Pedrali-Noy, Marzio

2004-05-18

An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

NASA Tech Briefs, November 1998. Volume 22, No. 11

NASA Technical Reports Server (NTRS)

1998-01-01

Topics include: special coverage sections on test and measurement and sections on electronic components and circuits, electronic systems, software, materials, mechanics, machinery/automation, physical sciences, information sciences, book and reports, and special sections of Electronics Tech Briefs amd Rapid Product Development Tech Briefs.

49 CFR 236.587 - Departure test.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Departure test. 236.587 Section 236.587..., Train Control and Cab Signal Systems Inspection and Tests; Locomotive § 236.587 Departure test. (a) The...: (1) Operation over track elements; (2) Operation over test circuit; (3) Use of portable test...

49 CFR 234.249 - Ground tests.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Ground tests. 234.249 Section 234.249... EMERGENCY NOTIFICATION SYSTEMS Maintenance, Inspection, and Testing Inspections and Tests § 234.249 Ground tests. A test for grounds on each energy bus furnishing power to circuits that affect the safety of...

49 CFR 236.587 - Departure test.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Departure test. 236.587 Section 236.587..., Train Control and Cab Signal Systems Inspection and Tests; Locomotive § 236.587 Departure test. (a) The...: (1) Operation over track elements; (2) Operation over test circuit; (3) Use of portable test...

Annular electromagnetic pumps-construction and testing-theory, and comparison with experimental results; Pompes electromagnetiques annulaires - construction et essais - theorie et confrontation avec l'experience (in French)

DOE Office of Scientific and Technical Information (OSTI.GOV)

Cambillard, Etienne P.; Schwab, Bernard L.

1964-07-15

This report consists of three sections. the first is concerned with the description of different pumps which have been constructed, tests on these which have been completed, and the results obtained. The second section presents a theoretical method for the determination of the coefficients, taking in account the break of the magnetic circuit. It is shown that the preliminary design calculations of the annular pumps can be made, neglecting the break of the magnetic circuit, by further assigning essential magnitudes (pressure, losses) with easily calculated coefficients. the third section of this report uses the theoretical bases exposed in the secondmore » section, and develops a new annular pump calculation method which takes into account bot the current out of balance and any type of winding.« less

Packaging Of Control Circuits In A Robot Arm

NASA Technical Reports Server (NTRS)

Kast, William

1994-01-01

Packaging system houses and connects control circuitry mounted on circuit boards within shoulder, upper section, and lower section of seven-degree-of-freedom robot arm. Has modular design that incorporates surface-mount technology, multilayer circuit boards, large-scale integrated circuits, and multi-layer flat cables between sections for compactness. Three sections of robot arm contain circuit modules in form of stardardized circuit boards. Each module contains two printed-circuit cards, one of each face.

Calibration of the 13- by 13-inch adaptive wall test section for the Langley 0.3-meter transonic cryogenic tunnel

NASA Technical Reports Server (NTRS)

Mineck, Raymond E.; Hill, Acquilla S.

1990-01-01

A 13 by 13 inch adaptive wall test section was installed in the 0.3 Meter Transonic Cryogenic Tunnel circuit. This new test section is configured for 2-D airfoil testing. It has four solid walls. The top and bottom walls are flexible and movable whereas the sidewalls are rigid and fixed. The wall adaptation strategy employed requires the test section wall shapes associated with uniform test section Mach number distributions. Calibration tests with the test section empty were conducted with the top and bottom walls linearly diverged to approach a uniform Mach number distribution. Pressure distributions were measured in the contraction cone, the test section, and the high speed diffuser at Mach numbers from 0.20 to 0.95 and Reynolds numbers from 10 to 100 x 10 (exp 6)/per foot.

Design and implementation of a programming circuit in radiation-hardened FPGA

NASA Astrophysics Data System (ADS)

Lihua, Wu; Xiaowei, Han; Yan, Zhao; Zhongli, Liu; Fang, Yu; Chen, Stanley L.

2011-08-01

We present a novel programming circuit used in our radiation-hardened field programmable gate array (FPGA) chip. This circuit provides the ability to write user-defined configuration data into an FPGA and then read it back. The proposed circuit adopts the direct-access programming point scheme instead of the typical long token shift register chain. It not only saves area but also provides more flexible configuration operations. By configuring the proposed partial configuration control register, our smallest configuration section can be conveniently configured as a single data and a flexible partial configuration can be easily implemented. The hierarchical simulation scheme, optimization of the critical path and the elaborate layout plan make this circuit work well. Also, the radiation hardened by design programming point is introduced. This circuit has been implemented in a static random access memory (SRAM)-based FPGA fabricated by a 0.5 μm partial-depletion silicon-on-insulator CMOS process. The function test results of the fabricated chip indicate that this programming circuit successfully realizes the desired functions in the configuration and read-back. Moreover, the radiation test results indicate that the programming circuit has total dose tolerance of 1 × 105 rad(Si), dose rate survivability of 1.5 × 1011 rad(Si)/s and neutron fluence immunity of 1 × 1014 n/cm2.

A new approach to equipment testing

NASA Technical Reports Server (NTRS)

Hardwick, C. J.; Dunkley, V. P.; Burrows, B. J. C.; Darney, I.

1991-01-01

Considerable controversy has arisen during the recent discussions over a new version of the RTCA DO160C/ED 14C Section 22 document at the European Committee for Aviation Electronics. Section 22 is concerned with lightning waveform tests to equipment. Investigations of some of these controversies with circuit analysis and measurements indicate the impedance characteristics required of the transient generators and the possibility of testing to a voltage limit even for current waveforms.

A new approach to equipment testing

NASA Astrophysics Data System (ADS)

Hardwick, C. J.; Dunkley, V. P.; Burrows, B. J. C.; Darney, I.

1991-08-01

Considerable controversy has arisen during the recent discussions over a new version of the RTCA DO160C/ED 14C Section 22 document at the European Committee for Aviation Electronics. Section 22 is concerned with lightning waveform tests to equipment. Investigations of some of these controversies with circuit analysis and measurements indicate the impedance characteristics required of the transient generators and the possibility of testing to a voltage limit even for current waveforms.

Electronic circuits: A compilation. [for electronic equipment in telecommunication

NASA Technical Reports Server (NTRS)

1976-01-01

A compilation containing articles on newly developed electronic circuits and systems is presented. It is divided into two sections: (1) section 1 on circuits and techniques of particular interest in communications technology, and (2) section 2 on circuits designed for a variety of specific applications. The latest patent information available is also given. Circuit diagrams are shown.

Solid state television camera

NASA Technical Reports Server (NTRS)

1976-01-01

The design, fabrication, and tests of a solid state television camera using a new charge-coupled imaging device are reported. An RCA charge-coupled device arranged in a 512 by 320 format and directly compatible with EIA format standards was the sensor selected. This is a three-phase, sealed surface-channel array that has 163,840 sensor elements, which employs a vertical frame transfer system for image readout. Included are test results of the complete camera system, circuit description and changes to such circuits as a result of integration and test, maintenance and operation section, recommendations to improve the camera system, and a complete set of electrical and mechanical drawing sketches.

Modifications and Modelling of the Fission Surface Power Primary Test Circuit (FSP-PTC)

NASA Technical Reports Server (NTRS)

Garber, Ann E.

2008-01-01

An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, underwent a range of tests at MSFC in early 2007. During this period, system transient responses and the performance of the liquid metal pump were evaluated. In May of 2007, the circuit was drained and cleaned to prepare for multiple modifications: the addition of larger upper and lower reservoirs, the installation of an annular linear induction pump (ALIP), and the inclusion of the Single Flow Cell Test Apparatus (SFCTA) in the test section. Performance of the ALIP, provided by Idaho National Laboratory (INL), will be evaluated when testing resumes. The SFCTA, which will be tested simultaneously, will provide data on alkali metal flow behavior through the simulated core channels and assist in the development of a second generation thermal simulator. Additionally, data from the first round of testing has been used to refine the working system model, developed using the Generalized Fluid System Simulation Program (GFSSP). This paper covers the modifications of the FSP-PTC and the updated GFSSP system model.

Submicrosecond Power-Switching Test Circuit

NASA Technical Reports Server (NTRS)

Folk, Eric N.

2006-01-01

A circuit that changes an electrical load in a switching time shorter than 0.3 microsecond has been devised. This circuit can be used in testing the regulation characteristics of power-supply circuits . especially switching power-converter circuits that are supposed to be able to provide acceptably high degrees of regulation in response to rapid load transients. The combination of this power-switching circuit and a known passive constant load could be an attractive alternative to a typical commercially available load-bank circuit that can be made to operate in nominal constant-voltage, constant-current, and constant-resistance modes. The switching provided by a typical commercial load-bank circuit in the constant-resistance mode is not fast enough for testing of regulation in response to load transients. Moreover, some test engineers do not trust the test results obtained when using commercial load-bank circuits because the dynamic responses of those circuits are, variously, partly unknown and/or excessively complex. In contrast, the combination of this circuit and a passive constant load offers both rapid switching and known (or at least better known) load dynamics. The power-switching circuit (see figure) includes a signal-input section, a wide-hysteresis Schmitt trigger that prevents false triggering in the event of switch-contact bounce, a dual-bipolar-transistor power stage that drives the gate of a metal oxide semiconductor field-effect transistor (MOSFET), and the MOSFET, which is the output device that performs the switching of the load. The MOSFET in the specific version of the circuit shown in the figure is rated to stand off a potential of 100 V in the "off" state and to pass a current of 20 A in the "on" state. The switching time of this circuit (the characteristic time of rise or fall of the potential at the drain of the MOSFET) is .300 ns. The circuit can accept any of three control inputs . which one depending on the test that one seeks to perform: a repetitive waveform from a signal generator, momentary closure of a push-button switch, or closure or opening of a manually operated on/off switch. In the case of a signal generator, one can adjust the frequency and duty cycle as needed to obtain the desired AC power-supply response, which one could display on an oscilloscope. Momentary switch closure could be useful for obtaining (and, if desired, displaying on an oscilloscope set to trigger on an event) the response of a power supply to a single load transient. The on/off switch can be used to switch between load states in which static-load regulation measurements are performed.

49 CFR 236.576 - Roadway element.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Roadway element. 236.576 Section 236.576..., Train Control and Cab Signal Systems Inspection and Tests; Roadway § 236.576 Roadway element. Roadway elements, except track circuits, including those for test purposes, shall be gaged monthly for height and...

49 CFR 236.576 - Roadway element.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Roadway element. 236.576 Section 236.576..., Train Control and Cab Signal Systems Inspection and Tests; Roadway § 236.576 Roadway element. Roadway elements, except track circuits, including those for test purposes, shall be gaged monthly for height and...

49 CFR 236.576 - Roadway element.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Roadway element. 236.576 Section 236.576..., Train Control and Cab Signal Systems Inspection and Tests; Roadway § 236.576 Roadway element. Roadway elements, except track circuits, including those for test purposes, shall be gaged monthly for height and...

Failure analysis of electronic parts: Laboratory methods. [for destructive and nondestructive testing

NASA Technical Reports Server (NTRS)

Anstead, R. J. (Editor); Goldberg, E. (Editor)

1975-01-01

Failure analysis test methods are presented for use in analyzing candidate electronic parts and in improving future design reliability. Each test is classified as nondestructive, semidestructive, or destructive. The effects upon applicable part types (i.e. integrated circuit, transitor) are discussed. Methodology is given for performing the following: immersion tests, radio graphic tests, dewpoint tests, gas ambient analysis, cross sectioning, and ultraviolet examination.

46 CFR 111.12-5 - Construction and testing of generators.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 46 Shipping 4 2011-10-01 2011-10-01 false Construction and testing of generators. 111.12-5 Section 111.12-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and...

46 CFR 111.12-5 - Construction and testing of generators.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 46 Shipping 4 2014-10-01 2014-10-01 false Construction and testing of generators. 111.12-5 Section 111.12-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and...

46 CFR 111.12-5 - Construction and testing of generators.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 46 Shipping 4 2012-10-01 2012-10-01 false Construction and testing of generators. 111.12-5 Section 111.12-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and...

46 CFR 111.12-5 - Construction and testing of generators.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 46 Shipping 4 2013-10-01 2013-10-01 false Construction and testing of generators. 111.12-5 Section 111.12-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and...

46 CFR 111.12-5 - Construction and testing of generators.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 4 2010-10-01 2010-10-01 false Construction and testing of generators. 111.12-5 Section 111.12-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-5 Construction and...

30 CFR 75.820 - Electrical work; troubleshooting and testing.

Code of Federal Regulations, 2010 CFR

2010-07-01

... installed the lock and tag is aware of the removal before that person resumes work on the affected circuit... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Electrical work; troubleshooting and testing. 75.820 Section 75.820 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR...

77 FR 14167 - Approval Tests and Standards for Closed-Circuit Escape Respirators

Federal Register 2010, 2011, 2012, 2013, 2014

2012-03-08

... Dioxide 3. Oxygen 4. Peak Breathing Pressures 5. Wet-Bulb Temperature L. Section 84.304 Capacity Test... oxygen storage or chemical carbon dioxide scrubber can be altered by impact or any other effect must... inhaled carbon dioxide, average inhaled oxygen, peak breathing pressures, and wet-bulb temperature...

SEM probe of IC radiation sensitivity

NASA Technical Reports Server (NTRS)

Gauthier, M. K.; Stanley, A. G.

1979-01-01

Scanning Electron Microscope (SEM) used to irradiate single integrated circuit (IC) subcomponent to test for radiation sensitivity can localize area of IC less than .03 by .03 mm for determination of exact location of radiation sensitive section.

Comparison of options for reduction of noise in the test section of the NASA Langley 4x7m wind tunnel, including reduction of nozzle area

NASA Technical Reports Server (NTRS)

Hayden, R. E.

1984-01-01

The acoustically significant features of the NASA 4X7m wind tunnel and the Dutch-German DNW low speed tunnel are compared to illustrate the reasons for large differences in background noise in the open jet test sections of the two tunnels. Also introduced is the concept of reducing test section noise levels through fan and turning vane source reductions which can be brought about by reducing the nozzle cross sectional area, and thus the circuit mass flow for a particular exit velocity. The costs and benefits of treating sources, paths, and changing nozzle geometry are reviewed.

Exterior of Flexible Wall at the 10- by 10-Foot Supersonic Wind Tunnel

NASA Image and Video Library

1955-03-21

A mechanic checks the tubing on one of the many jacks which control the nozzle section of the 10- by 10-Foot Supersonic Wind Tunnel at the National Advisory Committee for Aeronautics (NACA) Lewis Flight Propulsion Laboratory. The 10- by 10-foot tunnel, which had its official opening in May 1956, was built under the Congressional Unitary Plan Act which coordinated wind tunnel construction at the NACA, Air Force, industry, and universities. The 10- by 10 was the largest of the three NACA tunnels built under the act. The 10- by 10 wind tunnel can be operated as a closed circuit for aerodynamic tests or as an open circuit for propulsion investigations. The 10-foot tall and 76-foot long stainless steel nozzle section just upstream from the test section can be adjusted to change the speed and composition of the air flow. Hydraulic jacks, seen in this photograph, flex the 1.37-inch thick walls of the tunnel nozzle. The size of the nozzle’s opening controls the velocity of the air through the test section. Seven General Electric motors capable of generating 25,000 horsepower produce the Mach 2.5 and 2.5 airflows. The facility was mostly operated at night due to its large power load requirements.

Stainless Steel NaK-Cooled Circuit (SNaKC) Fabrication and Assembly

NASA Technical Reports Server (NTRS)

Godfroy, Thomas J.

2007-01-01

An actively pumped Stainless Steel NaK Circuit (SNaKC) has been designed and fabricated by the Early Flight Fission Test Facility (EFF-TF) team at NASA's Marshall Space Flight Center. This circuit uses the eutectic mixture of sodium and potassium (NaK) as the working fluid building upon the experience and accomplishments of the SNAP reactor program from the late 1960's The SNaKC enables valuable experience and liquid metal test capability to be gained toward the goal of designing and building an affordable surface power reactor. The basic circuit components include a simulated reactor core a NaK to gas heat exchanger, an electromagnetic (EM) liquid metal pump, a liquid metal flow meter, an expansion reservoir and a drain/fill reservoir To maintain an oxygen free environment in the presence of NaK, an argon system is utilized. A helium and nitrogen system are utilized for core, pump, and heat exchanger operation. An additional rest section is available to enable special component testing m an elevated temperature actively pumped liquid metal environment. This paper summarizes the physical build of the SNaKC the gas and pressurization systems, vacuum systems, as well as instrumentation and control methods.

40 CFR 1037.525 - Special procedures for testing hybrid vehicles with power take-off.

Code of Federal Regulations, 2014 CFR

2014-07-01

... of this section to allow testing hybrid vehicles other than electric-battery hybrids, consistent with... model, use good engineering judgment to select the vehicle type with the maximum number of PTO circuits... as needed to stabilize the battery at a full state of charge. For electric hybrid vehicles, we...

Womens Services v. Thone.

PubMed

1982-10-14

The U.S. Court of Appeals for the Eighth Circuit affirmed the ruling of the U.S. District Court for the District of Nebraska that sections of Nebraska statutes regulating abortion were unconstitutional. The original issue in the case was the validity of the parental consultation requirement for minors under the age of eighteen but, on appeal of the decision on remand, the appropriate standard of review for statutes which regulate abortions was questioned. The Eighth Circuit continued to apply the strict scrutiny test.

Acoustical modeling study of the open test section of the NASA Langley V/STOL wind tunnel

NASA Technical Reports Server (NTRS)

Ver, I. L.; Andersen, D. W.; Bliss, D. B.

1975-01-01

An acoustic model study was carried out to identify effective sound absorbing treatment of strategically located surfaces in an open wind tunnel test section. Also an aerodynamic study done concurrently, sought to find measures to control low frequency jet pulsations which occur when the tunnel is operated in its open test section configuration. The acoustical modeling study indicated that lining of the raised ceiling and the test section floor immediately below it, results in a substantial improvement. The aerodynamic model study indicated that: (1) the low frequency jet pulsations are most likely caused or maintained by coupling of aerodynamic and aeroacoustic phenomena in the closed tunnel circuit, (2) replacing the hard collector cowl with a geometrically identical but porous fiber metal surface of 100 mks rayls flow resistance does not result in any noticable reduction of the test section noise caused by the impingement of the turbulent flow on the cowl.

Simulation of SEU Cross-sections using MRED under Conditions of Limited Device Information

NASA Technical Reports Server (NTRS)

Lauenstein, J. M.; Reed, R. A.; Weller, R. A.; Mendenhall, M. H.; Warren, K. M.; Pellish, J. A.; Schrimpf, R. D.; Sierawski, B. D.; Massengill, L. W.; Dodd, P. E.;

Analysis of Fluctuating Static Pressure Measurements in a Large High Reynolds Number Transonic Cryogenic Wind Tunnel. Ph.D. Thesis

NASA Technical Reports Server (NTRS)

Igoe, William B.

1991-01-01

Dynamic measurements of fluctuating static pressure levels were made using flush mounted high frequency response pressure transducers at eleven locations in the circuit of the National Transonic Facility (NTF) over the complete operating range of this wind tunnel. Measurements were made at test section Mach numbers from 0.2 to 1.2, at pressure from 1 to 8.6 atmospheres and at temperatures from ambient to -250 F, resulting in dynamic flow disturbance measurements at the highest Reynolds numbers available in a transonic ground test facility. Tests were also made independently at variable Mach number, variable Reynolds number, and variable drivepower, each time keeping the other two variables constant thus allowing for the first time, a distinct separation of these three important variables. A description of the NTF emphasizing its flow quality features, details on the calibration of the instrumentation, results of measurements with the test section slots covered, downstream choke, effects of liquid nitrogen injection and gaseous nitrogen venting, comparisons between air and nitrogen, isolation of the effects of Mach number, Reynolds number, and fan drive power, and identification of the sources of significant flow disturbances is included. The results indicate that primary sources of flow disturbance in the NTF may be edge-tones generated by test section sidewall re-entry flaps and the venting of nitrogen gas from the return leg of the tunnel circuit between turns 3 and 4 in the cryogenic mode of operation. The tests to isolate the effects of Mach number, Reynolds number, and drive power indicate that Mach number effects predominate. A comparison with other transonic wind tunnels shows that the NTF has low levels of test section fluctuating static pressure especially in the high subsonic Mach number range from 0.7 to 0.9.

Study of methods of improving the performance of the Langley Research Center Transonic Dynamics Tunnel (TDT)

NASA Technical Reports Server (NTRS)

1973-01-01

A study has been made of possible ways to improve the performance of the Langley Research Center's Transonic Dynamics Tunnel (TDT). The major effort was directed toward obtaining increased dynamic pressure in the Mach number range from 0.8 to 1.2, but methods to increase Mach number capability were also considered. Methods studied for increasing dynamic pressure capability were higher total pressure, auxiliary suction, reducing circuit losses, reduced test medium temperature, smaller test section and higher molecular weight test medium. Increased Mach number methods investigated were nozzle block inserts, variable geometry nozzle, changes in test section wall configuration, and auxiliary suction.

49 CFR 236.798 - Section, dead.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Section, dead. 236.798 Section 236.798 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Section, dead. A section of track, either within a track circuit or between two track circuits, the rails...

49 CFR 236.798 - Section, dead.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Section, dead. 236.798 Section 236.798 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Section, dead. A section of track, either within a track circuit or between two track circuits, the rails...

49 CFR 236.798 - Section, dead.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Section, dead. 236.798 Section 236.798 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Section, dead. A section of track, either within a track circuit or between two track circuits, the rails...

49 CFR 236.798 - Section, dead.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Section, dead. 236.798 Section 236.798 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Section, dead. A section of track, either within a track circuit or between two track circuits, the rails...

49 CFR 236.798 - Section, dead.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Section, dead. 236.798 Section 236.798 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Section, dead. A section of track, either within a track circuit or between two track circuits, the rails...

Apparatus for and method of testing an electrical ground fault circuit interrupt device

DOEpatents

Andrews, L.B.

1998-08-18

An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined. 17 figs.

Apparatus for and method of testing an electrical ground fault circuit interrupt device

DOEpatents

Andrews, Lowell B.

1998-01-01

An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.

30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

Code of Federal Regulations, 2010 CFR

2010-07-01

... short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... Equipment-General § 75.518 Electric equipment and circuits; overload and short circuit protection... installed so as to protect all electric equipment and circuits against short circuit and overloads. Three...

30 CFR 28.40 - Construction and performance requirements; general.

Code of Federal Regulations, 2012 CFR

2012-07-01

.... Department of Labor, Mine Safety and Health Administration, Approval and Certification Center, 765 Technology...; general. 28.40 Section 28.40 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR...-CIRCUIT PROTECTION FOR TRAILING CABLES IN COAL MINES Construction, Performance, and Testing Requirements...

30 CFR 28.40 - Construction and performance requirements; general.

Code of Federal Regulations, 2014 CFR

2014-07-01

.... Department of Labor, Mine Safety and Health Administration, Approval and Certification Center, 765 Technology...; general. 28.40 Section 28.40 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR...-CIRCUIT PROTECTION FOR TRAILING CABLES IN COAL MINES Construction, Performance, and Testing Requirements...

30 CFR 28.40 - Construction and performance requirements; general.

Code of Federal Regulations, 2011 CFR

2011-07-01

.... Department of Labor, Mine Safety and Health Administration, Approval and Certification Center, 765 Technology...; general. 28.40 Section 28.40 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR...-CIRCUIT PROTECTION FOR TRAILING CABLES IN COAL MINES Construction, Performance, and Testing Requirements...

30 CFR 28.40 - Construction and performance requirements; general.

Code of Federal Regulations, 2013 CFR

2013-07-01

.... Department of Labor, Mine Safety and Health Administration, Approval and Certification Center, 765 Technology...; general. 28.40 Section 28.40 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR...-CIRCUIT PROTECTION FOR TRAILING CABLES IN COAL MINES Construction, Performance, and Testing Requirements...

Analytical modeling of circuit aerodynamics in the new NASA Lewis wind tunnel

NASA Technical Reports Server (NTRS)

Towne, C. E.; Povinelli, L. A.; Kunik, W. G.; Muramoto, K. K.; Hughes, C. E.; Levy, R.

1985-01-01

Rehabilitation and extention of the capability of the altitude wind tunnel (AWT) was analyzed. The analytical modeling program involves the use of advanced axisymmetric and three dimensional viscous analyses to compute the flow through the various AWT components. Results for the analytical modeling of the high speed leg aerodynamics are presented; these include: an evaluation of the flow quality at the entrance to the test section, an investigation of the effects of test section bleed for different model blockages, and an examination of three dimensional effects in the diffuser due to reentry flow and due to the change in cross sectional shape of the exhaust scoop.

49 CFR 236.52 - Relayed cut-section.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Relayed cut-section. 236.52 Section 236.52...: All Systems Track Circuits § 236.52 Relayed cut-section. Where relayed cut-section is used in... shall be open and the track circuit shunted when the track relay at such cut-section is in deenergized...

49 CFR 236.52 - Relayed cut-section.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Relayed cut-section. 236.52 Section 236.52...: All Systems Track Circuits § 236.52 Relayed cut-section. Where relayed cut-section is used in... shall be open and the track circuit shunted when the track relay at such cut-section is in deenergized...

Evaluation the course of the vehicle braking process in case of hydraulic circuit malfunction

NASA Astrophysics Data System (ADS)

Szczypiński-Sala, W.; Lubas, J.

2016-09-01

In the paper, the results of the research were discussed, the aim of which was the evaluation of the vehicle braking performance efficiency and the course of this process with regard to the dysfunction which may occur in braking hydraulic circuit. As part of the research, on-road tests were conducted. During the research, the delay of the vehicle when braking was measured with the use of the set of sensors placed in the parallel and the perpendicular axis of the vehicle. All the tests were conducted on the same flat section of asphalt road with wet surface. Conditions of diminished tire-to-road adhesion were chosen in order to force the activity of anti-lock braking system. The research was conducted comparatively for the vehicle with acting anti-lock braking system and subsequently for the vehicle without the system. In both cases, there was a subsequent evaluation of the course of braking with efficient braking system and with the dysfunction of hydraulic circuit.

Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications

NASA Astrophysics Data System (ADS)

Secondo, R.; Alía, R. Garcia; Peronnard, P.; Brugger, M.; Masi, A.; Danzeca, S.; Merlenghi, A.; Vaillé, J.-R.; Dusseau, L.

2017-08-01

A single event latchup (SEL) experiment based on commercial static random access memory (SRAM) memories has recently been proposed in the framework of the European Organization for Nuclear Research (CERN) Latchup Experiment and Student Satellite nanosatellite low Earth orbit (LEO) space mission. SEL characterization of three commercial SRAM memories has been carried out at the Paul Scherrer Institut (PSI) facility, using monoenergetic focused proton beams and different acquisition setups. The best target candidate was selected and a circuit for SEL detection has been proposed and tested at CERN, in the CERN High Energy AcceleRator Mixed-field facility (CHARM). Experimental results were carried out at test locations representative of the LEO environment, thus providing a full characterization of the SRAM cross sections, together with the analysis of the single-event effect and total ionizing dose of the latchup detection circuit in relation to the particle spectra expected during mission. The setups used for SEL monitoring are described, and details of the proposed circuit components and topology are presented. Experimental results obtained both at PSI and at CHARM facilities are discussed.

30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

Code of Federal Regulations, 2010 CFR

2010-07-01

... short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuits; overload and short-circuit protection. Automatic circuit-breaking devices or fuses of the correct type and capacity shall be installed so as to protect all electric equipment and circuits against short...

30 CFR 28.22 - Notice of disapproval.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Notice of disapproval. 28.22 Section 28.22 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR TESTING, EVALUATION, AND APPROVAL OF MINING PRODUCTS FUSES FOR USE WITH DIRECT CURRENT IN PROVIDING SHORT-CIRCUIT PROTECTION FOR...

Electronic test and calibration circuits, a compilation

NASA Technical Reports Server (NTRS)

1972-01-01

A wide variety of simple test calibration circuits are compiled for the engineer and laboratory technician. The majority of circuits were found inexpensive to assemble. Testing electronic devices and components, instrument and system test, calibration and reference circuits, and simple test procedures are presented.

A device for testing cables

NASA Technical Reports Server (NTRS)

Hayhurst, Arthur Ray (Inventor)

1993-01-01

A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield, and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2010 CFR

2010-07-01

... short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY...-1 Electric equipment and circuits; overload and short circuit protection; minimum requirements. Devices providing either short circuit protection or protection against overload shall conform to the...

30 CFR 75.900 - Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit...

Code of Federal Regulations, 2011 CFR

2011-07-01

...-phase alternating current equipment; circuit breakers. 75.900 Section 75.900 Mineral Resources MINE... Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit breakers. [Statutory Provisions] Low- and medium-voltage power circuits serving three-phase alternating current...

49 CFR 236.723 - Circuit, double wire; line.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, double wire; line. 236.723 Section 236... § 236.723 Circuit, double wire; line. An electric circuit not employing a common return wire; a circuit formed by individual wires throughout. ...

49 CFR 236.723 - Circuit, double wire; line.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Circuit, double wire; line. 236.723 Section 236... § 236.723 Circuit, double wire; line. An electric circuit not employing a common return wire; a circuit formed by individual wires throughout. ...

Circuit for monitoring temperature of high-voltage equipment

DOEpatents

Jacobs, Martin E.

1976-01-01

This invention relates to an improved circuit for measuring temperature in a region at high electric potential and generating a read-out of the same in a region at lower potential. The circuit is specially designed to combine high sensitivity, stability, and accuracy. A major portion of the circuit situated in the high-potential region can take the form of an integrated circuit. The preferred form of the circuit includes an input section which is situated in the high-potential region and comprises a temperature-compensated thermocouple circuit for sensing temperature, an oscillator circuit for generating a train of ramp voltages whose rise time varies inversely with the thermocouple output, a comparator and switching circuit for converting the oscillator output to pulses whose frequency is proportional to the thermocouple output, and a light-emitting diode which is energized by these pulses. An optical coupling transmits the light pulses generated by the diode to an output section of the circuit, situated in a region at ground. The output section comprises means for converting the transmitted pulses to electrical pulses of corresponding frequency, means for amplifying the electrical pulses, and means for displaying the frequency of the same. The preferred embodiment of the overall circuit is designed so that the frequency of the output signal in hertz and tenths of hertz is equal to the sensed temperature in degrees and tenths of degrees.

Device for testing continuity and/or short circuits in a cable

NASA Technical Reports Server (NTRS)

Hayhurst, Arthur R. (Inventor)

1995-01-01

A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of the cable. The pair of connectors electrically connects the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

An Activity for Demonstrating the Concept of a Neural Circuit

ERIC Educational Resources Information Center

Kreiner, David S.

2012-01-01

College students in two sections of a general psychology course participated in a demonstration of a simple neural circuit. The activity was based on a neural circuit that Jeffress proposed for localizing sounds. Students in one section responded to a questionnaire prior to participating in the activity, while students in the other section…

30 CFR 28.24 - Revocation of certificates of approval.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Revocation of certificates of approval. 28.24 Section 28.24 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR TESTING, EVALUATION, AND APPROVAL OF MINING PRODUCTS FUSES FOR USE WITH DIRECT CURRENT IN PROVIDING SHORT-CIRCUIT...

30 CFR 28.20 - Certificates of approval; scope of approval.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Certificates of approval; scope of approval. 28.20 Section 28.20 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR TESTING, EVALUATION, AND APPROVAL OF MINING PRODUCTS FUSES FOR USE WITH DIRECT CURRENT IN PROVIDING SHORT-CIRCUIT...

49 CFR 234.227 - Train detection apparatus.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Train detection apparatus. 234.227 Section 234.227..., Inspection, and Testing Maintenance Standards § 234.227 Train detection apparatus. (a) Train detection apparatus shall be maintained to detect a train or railcar in any part of a train detection circuit, in...

49 CFR 234.227 - Train detection apparatus.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Train detection apparatus. 234.227 Section 234.227..., Inspection, and Testing Maintenance Standards § 234.227 Train detection apparatus. (a) Train detection apparatus shall be maintained to detect a train or railcar in any part of a train detection circuit, in...

Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements

NASA Astrophysics Data System (ADS)

Savin, A. A.; Guba, V. G.; Ladur, A. A.; Bykova, O. N.

2018-05-01

This paper is dedicated to a new method of high frequency circuits material properties extraction based on the reflection measurements of a line shorted two or more times along its length. The line should be fabricated on the material under test. To achieve more precise calculation results, the proposed method uses processing in the time domain. The experimental results section shows obtained assessments for relative permittivity and dielectric loss tangent of the RO4350B hydrocarbon ceramic laminate. Measurements have been conducted over the frequency range up to 20 GHz.

49 CFR 236.786 - Principle, closed circuit.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Principle, closed circuit. 236.786 Section 236.786 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Principle, closed circuit. The principle of circuit design where a normally energized electric circuit which...

49 CFR 236.725 - Circuit, switch shunting.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Circuit, switch shunting. 236.725 Section 236.725 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, switch shunting. A shunting circuit which is closed through contacts of a switch circuit...

49 CFR 236.725 - Circuit, switch shunting.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Circuit, switch shunting. 236.725 Section 236.725 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, switch shunting. A shunting circuit which is closed through contacts of a switch circuit...

49 CFR 236.725 - Circuit, switch shunting.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, switch shunting. 236.725 Section 236.725 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, switch shunting. A shunting circuit which is closed through contacts of a switch circuit...

49 CFR 236.725 - Circuit, switch shunting.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Circuit, switch shunting. 236.725 Section 236.725 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, switch shunting. A shunting circuit which is closed through contacts of a switch circuit...

49 CFR 236.725 - Circuit, switch shunting.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Circuit, switch shunting. 236.725 Section 236.725 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, switch shunting. A shunting circuit which is closed through contacts of a switch circuit...

Full circuit calculation for electromagnetic pulse transmission in a high current facility

NASA Astrophysics Data System (ADS)

Zou, Wenkang; Guo, Fan; Chen, Lin; Song, Shengyi; Wang, Meng; Xie, Weiping; Deng, Jianjun

2014-11-01

We describe herein for the first time a full circuit model for electromagnetic pulse transmission in the Primary Test Stand (PTS)—the first TW class pulsed power driver in China. The PTS is designed to generate 8-10 MA current into a z -pinch load in nearly 90 ns rise time for inertial confinement fusion and other high energy density physics research. The PTS facility has four conical magnetic insulation transmission lines, in which electron current loss exists during the establishment of magnetic insulation. At the same time, equivalent resistance of switches and equivalent inductance of pinch changes with time. However, none of these models are included in a commercially developed circuit code so far. Therefore, in order to characterize the electromagnetic transmission process in the PTS, a full circuit model, in which switch resistance, magnetic insulation transmission line current loss and a time-dependent load can be taken into account, was developed. Circuit topology and an equivalent circuit model of the facility were introduced. Pulse transmission calculation of shot 0057 was demonstrated with the corresponding code FAST (full-circuit analysis and simulation tool) by setting controllable parameters the same as in the experiment. Preliminary full circuit simulation results for electromagnetic pulse transmission to the load are presented. Although divergences exist between calculated and experimentally obtained waveforms before the vacuum section, consistency with load current is satisfactory, especially at the rising edge.

30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY... short circuit protection; minimum requirements. A device to provide either short circuit protection or...

49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

Code of Federal Regulations, 2010 CFR

2010-10-01

... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

Code of Federal Regulations, 2012 CFR

2012-10-01

... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

Code of Federal Regulations, 2013 CFR

2013-10-01

... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

Code of Federal Regulations, 2014 CFR

2014-10-01

... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

Code of Federal Regulations, 2011 CFR

2011-10-01

... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

The test of VLSI circuits

NASA Astrophysics Data System (ADS)

Baviere, Ph.

Tests which have proven effective for evaluating VLSI circuits for space applications are described. It is recommended that circuits be examined after each manfacturing step to gain fast feedback on inadequacies in the production system. Data from failure modes which occur during operational lifetimes of circuits also permit redefinition of the manufacturing and quality control process to eliminate the defects identified. Other tests include determination of the operational envelope of the circuits, examination of the circuit response to controlled inputs, and the performance and functional speeds of ROM and RAM memories. Finally, it is desirable that all new circuits be designed with testing in mind.

49 CFR 236.731 - Controller, circuit.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Controller, circuit. 236.731 Section 236.731 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Controller, circuit. A device for opening and closing electric circuits. ...

30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2010 CFR

2010-07-01

..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least once... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

46 CFR 169.670 - Circuit breakers.

Code of Federal Regulations, 2010 CFR

2010-10-01

... Gross Tons § 169.670 Circuit breakers. Each circuit breaker must be of the manually reset type designed for— (a) Inverse time delay; (b) Instantaneous short circuit protection; and (c) Repeated opening of... 46 Shipping 7 2010-10-01 2010-10-01 false Circuit breakers. 169.670 Section 169.670 Shipping COAST...

30 CFR 57.12017 - Work on power circuits.

Code of Federal Regulations, 2010 CFR

2010-07-01

... shall prevent the power circuits from being energized without the knowledge of the individuals working... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Work on power circuits. 57.12017 Section 57... Surface and Underground § 57.12017 Work on power circuits. Power circuits shall be deenergized before work...

30 CFR 75.900-1 - Circuit breakers; location.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit breakers; location. 75.900-1 Section 75.900-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... Alternating Current Circuits § 75.900-1 Circuit breakers; location. Circuit breakers used to protect low-and...

30 CFR 75.800-1 - Circuit breakers; location.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit breakers; location. 75.800-1 Section 75.800-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... § 75.800-1 Circuit breakers; location. Circuit breakers protecting high-voltage circuits entering an...

The Langley 14- by 22-Foot Subsonic Tunnel: Description, Flow Characteristics, and Guide for Users

NASA Technical Reports Server (NTRS)

Gentry, Garl L., Jr.; Quinto, P. Frank; Gatlin, Gregory M.; Applin, Zachary T.

1990-01-01

The Langley 14- by 22-foot Subsonic Tunnel is a closed circuit, single-return atmospheric wind tunnel with a test section that can be operated in a variety of configurations (closed, slotted, partially open, and open). The closed test section configuration is 14.5 ft high by 21.75 ft wide and 50 ft long with a maximum speed of about 338 ft/sec. The open test section configuration has a maximum speed of about 270 ft/sec, and is formed by raising the ceiling and walls, to form a floor-only configuration. The tunnel may be configured with a moving-belt ground plane and a floor boundary-layer removal system at the entrance to the test section for ground effect testing. In addition, the tunnel had a two-component laser velocimeter, a frequency modulated (FM) tape system for dynamic data acquisition, flow visualization equipment, and acoustic testing capabilities. Users of the 14- by 22-foot Subsonic Tunnel are provided with information required for planning of experimental investigations including test hardware and model support systems.

Development, Integration and Testing of Automated Triggering Circuit for Hybrid DC Circuit Breaker

NASA Astrophysics Data System (ADS)

Kanabar, Deven; Roy, Swati; Dodiya, Chiragkumar; Pradhan, Subrata

2017-04-01

A novel concept of Hybrid DC circuit breaker having combination of mechanical switch and static switch provides arc-less current commutation into the dump resistor during quench in superconducting magnet operation. The triggering of mechanical and static switches in Hybrid DC breaker can be automatized which can effectively reduce the overall current commutation time of hybrid DC circuit breaker and make the operation independent of opening time of mechanical switch. With this view, a dedicated control circuit (auto-triggering circuit) has been developed which can decide the timing and pulse duration for mechanical switch as well as static switch from the operating parameters. This circuit has been tested with dummy parameters and thereafter integrated with the actual test set up of hybrid DC circuit breaker. This paper deals with the conceptual design of the auto-triggering circuit, its control logic and operation. The test results of Hybrid DC circuit breaker using this circuit have also been discussed.

30 CFR 28.4 - Definitions.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Definitions. 28.4 Section 28.4 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR TESTING, EVALUATION, AND APPROVAL OF MINING PRODUCTS FUSES FOR USE WITH DIRECT CURRENT IN PROVIDING SHORT-CIRCUIT PROTECTION FOR TRAILING CABLES IN COAL MINES General Provisions § 28.4...

Never Been KIST: Tor’s Congestion Management Blossoms with Kernel-Informed Socket Transport

DTIC Science & Technology

2014-08-01

when compared to vanilla Tor. Outline of Major Contributions: We outline our major contributions as follows: – in Section 3 we discuss improvements to...experiments. We tested vanilla Tor us- ing the default CircuitPriorityHalflife of 30, the global scheduling part of KIST (without enforcing the write limits

49 CFR 236.726 - Circuit, track.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, track. 236.726 Section 236.726 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, track. An electrical circuit of which the rails of the track form a part. ...

Electrical short circuit and current overload tests on aircraft wiring

NASA Technical Reports Server (NTRS)

Cahill, Patricia

1995-01-01

The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

Performance of the high speed anechoic wind tunnel at Lyon University

NASA Technical Reports Server (NTRS)

Sunyach, M.; Brunel, B.; Comte-Bellot, G.

1986-01-01

The characteristics of the feed duct, the wind tunnel, and the experiments run in the convergent-divergent anechoic wind tunnel at Lyon University are described. The wind tunnel was designed to eliminate noise from the entrance of air or from flow interactions with the tunnel walls so that noise caused by the flow-test structure interactions can be studied. The channel contains 1 x 1 x 0.2 m glass and metal foil baffles spaced 0.2 m apart. The flow is forced by a 350 kW fan in the primary circuit, and a 110 kW blower in the secondary circuit. The primary circuit features a factor of four throat reductions, followed by a 1.6 reduction before the test section. Upstream and downstream sensors permit monitoring of the anechoic effectiveness of the channel. Other sensors allow modeling of the flow structures in the tunnel. The tunnel was used to examine turbulent boundary layers in flows up to 140 m/sec, tubulence-excited vibrations in walls, and the effects of laminar and turbulent flows on the appearance and locations of noise sources.

Built-in-test by signature inspection (bitsi)

DOEpatents

Bergeson, Gary C.; Morneau, Richard A.

1991-01-01

A system and method for fault detection for electronic circuits. A stimulus generator sends a signal to the input of the circuit under test. Signature inspection logic compares the resultant signal from test nodes on the circuit to an expected signal. If the signals do not match, the signature inspection logic sends a signal to the control logic for indication of fault detection in the circuit. A data input multiplexer between the test nodes of the circuit under test and the signature inspection logic can provide for identification of the specific node at fault by the signature inspection logic. Control logic responsive to the signature inspection logic conveys information about fault detection for use in determining the condition of the circuit. When used in conjunction with a system test controller, the built-in test by signature inspection system and method can be used to poll a plurality of circuits automatically and continuous for faults and record the results of such polling in the system test controller.

42 CFR 84.93 - Gas flow test; open-circuit apparatus.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200 liters...

42 CFR 84.93 - Gas flow test; open-circuit apparatus.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; open-circuit apparatus. 84.93...-Contained Breathing Apparatus § 84.93 Gas flow test; open-circuit apparatus. (a) A static-flow test will be performed on all open-circuit apparatus. (b) The flow from the apparatus shall be greater than 200 liters...

Note: cryogenic microstripline-on-Kapton microwave interconnects.

PubMed

Harris, A I; Sieth, M; Lau, J M; Church, S E; Samoska, L A; Cleary, K

2012-08-01

Simple broadband microwave interconnects are needed for increasing the size of focal plane heterodyne radiometer arrays. We have measured loss and crosstalk for arrays of microstrip transmission lines in flex circuit technology at 297 and 77 K, finding good performance to at least 20 GHz. The dielectric constant of Kapton substrates changes very little from 297 to 77 K, and the electrical loss drops. The small cross-sectional area of metal in a printed circuit structure yields overall thermal conductivities similar to stainless steel coaxial cable. Operationally, the main performance tradeoffs are between crosstalk and thermal conductivity. We tested a patterned ground plane to reduce heat flux.

Integrated testing system FiTest for diagnosis of PCBA

NASA Astrophysics Data System (ADS)

Bogdan, Arkadiusz; Lesniak, Adam

2016-12-01

This article presents the innovative integrated testing system FiTest for automatic, quick inspection of printed circuit board assemblies (PCBA) manufactured in Surface Mount Technology (SMT). Integration of Automatic Optical Inspection (AOI), In-Circuit Tests (ICT) and Functional Circuit Tests (FCT) resulted in universal hardware platform for testing variety of electronic circuits. The platform provides increased test coverage, decreased level of false calls and optimization of test duration. The platform is equipped with powerful algorithms performing tests in a stable and repetitive way and providing effective management of diagnosis.

First-year university Physics students’ knowledge about direct current circuits: probing improvement in understanding as a function of teaching and learning interventions

NASA Astrophysics Data System (ADS)

Newman, Richard; van der Ventel, Brandon; Hanekom, Crischelle

2017-07-01

Probing university students’ understanding of direct-current (DC) resistive circuits is still a field of active physics education research. We report here on a study we conducted of this understanding, where the cohort consisted of students in a large-enrollment first-year physics module. This is a non-calculus based physics module for students in the life sciences stream. The study involved 366 students enrolled in the physics (bio) 154 module at Stellenbosch University in 2015. Students’ understanding of DC resistive circuits was probed by means of a standardized test instrument. The instrument comprises 29 multiple choice questions that students have to answer in ~40 min. Students were required to first complete the standardized test at the start of semester (July 2015). For ease of reference we call this test the pre-test. Students answered the pre-test having no university-level formal exposure to DC circuits in theory or practice. The pre-test therefore served to probe students’ school level knowledge of DC circuits. As the semester progressed students were exposed to a practical (E1), lectures, a prescribed textbook, a tutorial and online videos focusing on DC circuits. The E1 practical required students to solve DC circuit problems by means of physically constructing circuits, algebraically using Kirchhoff's Rules and Ohm’s Law, and by means of simulating circuits using the app iCircuit running on iPads (iOS platform). Each E1 practical involved ~50 students in a three hour session. The practical was repeated three afternoons per week over an eight week period. Twenty three iPads were distributed among students on a practical afternoon in order for them to do the circuit simulations in groups (of 4-5 students). At the end of the practical students were again required to do the standardized test on circuits and complete a survey on their experience of the use of the iPad and iCircuit app. For ease of reference we refer to this second test as the post-test. The students’ average score on the post-test was found to be ~25% higher than their pre-test score. The results of the iPad use survey show that the majority of students felt that the iCircuit app enhanced their learning of DC circuits.

49 CFR 236.732 - Controller, circuit; switch.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Controller, circuit; switch. 236.732 Section 236... § 236.732 Controller, circuit; switch. A device for opening and closing electric circuits, operated by a rod connected to a switch, derail or movable-point frog. ...

49 CFR 236.732 - Controller, circuit; switch.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Controller, circuit; switch. 236.732 Section 236... § 236.732 Controller, circuit; switch. A device for opening and closing electric circuits, operated by a rod connected to a switch, derail or movable-point frog. ...

49 CFR 236.732 - Controller, circuit; switch.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Controller, circuit; switch. 236.732 Section 236... § 236.732 Controller, circuit; switch. A device for opening and closing electric circuits, operated by a rod connected to a switch, derail or movable-point frog. ...

49 CFR 236.732 - Controller, circuit; switch.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Controller, circuit; switch. 236.732 Section 236... § 236.732 Controller, circuit; switch. A device for opening and closing electric circuits, operated by a rod connected to a switch, derail or movable-point frog. ...

49 CFR 236.732 - Controller, circuit; switch.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Controller, circuit; switch. 236.732 Section 236.732 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD... § 236.732 Controller, circuit; switch. A device for opening and closing electric circuits, operated by a...

47 CFR 32.2232 - Circuit equipment.

Code of Federal Regulations, 2011 CFR

2011-10-01

... subaccount 2232.1 Electronic shall include the original cost of electronic circuit equipment. (c) This... 47 Telecommunication 2 2011-10-01 2011-10-01 false Circuit equipment. 32.2232 Section 32.2232... FOR TELECOMMUNICATIONS COMPANIES Instructions for Balance Sheet Accounts § 32.2232 Circuit equipment...

47 CFR 32.2232 - Circuit equipment.

Code of Federal Regulations, 2012 CFR

2012-10-01

... subaccount 2232.1 Electronic shall include the original cost of electronic circuit equipment. (c) This... 47 Telecommunication 2 2012-10-01 2012-10-01 false Circuit equipment. 32.2232 Section 32.2232... FOR TELECOMMUNICATIONS COMPANIES Instructions for Balance Sheet Accounts § 32.2232 Circuit equipment...

47 CFR 32.2232 - Circuit equipment.

Code of Federal Regulations, 2010 CFR

2010-10-01

... subaccount 2232.1 Electronic shall include the original cost of electronic circuit equipment. (c) This... 47 Telecommunication 2 2010-10-01 2010-10-01 false Circuit equipment. 32.2232 Section 32.2232... FOR TELECOMMUNICATIONS COMPANIES Instructions for Balance Sheet Accounts § 32.2232 Circuit equipment...

47 CFR 32.6232 - Circuit equipment expense.

Code of Federal Regulations, 2011 CFR

2011-10-01

...) This subaccount 6232.1 Electronic shall include expenses associated with electronic circuit equipment... 47 Telecommunication 2 2011-10-01 2011-10-01 false Circuit equipment expense. 32.6232 Section 32... SYSTEM OF ACCOUNTS FOR TELECOMMUNICATIONS COMPANIES Instructions for Expense Accounts § 32.6232 Circuit...

47 CFR 32.2232 - Circuit equipment.

Code of Federal Regulations, 2013 CFR

2013-10-01

... subaccount 2232.1 Electronic shall include the original cost of electronic circuit equipment. (c) This... 47 Telecommunication 2 2013-10-01 2013-10-01 false Circuit equipment. 32.2232 Section 32.2232... FOR TELECOMMUNICATIONS COMPANIES Instructions for Balance Sheet Accounts § 32.2232 Circuit equipment...

47 CFR 32.6232 - Circuit equipment expense.

Code of Federal Regulations, 2012 CFR

2012-10-01

...) This subaccount 6232.1 Electronic shall include expenses associated with electronic circuit equipment... 47 Telecommunication 2 2012-10-01 2012-10-01 false Circuit equipment expense. 32.6232 Section 32... SYSTEM OF ACCOUNTS FOR TELECOMMUNICATIONS COMPANIES Instructions for Expense Accounts § 32.6232 Circuit...

47 CFR 32.2232 - Circuit equipment.

Code of Federal Regulations, 2014 CFR

2014-10-01

... subaccount 2232.1 Electronic shall include the original cost of electronic circuit equipment. (c) This... 47 Telecommunication 2 2014-10-01 2014-10-01 false Circuit equipment. 32.2232 Section 32.2232... FOR TELECOMMUNICATIONS COMPANIES Instructions for Balance Sheet Accounts § 32.2232 Circuit equipment...

47 CFR 32.6232 - Circuit equipment expense.

Code of Federal Regulations, 2013 CFR

2013-10-01

...) This subaccount 6232.1 Electronic shall include expenses associated with electronic circuit equipment... 47 Telecommunication 2 2013-10-01 2013-10-01 false Circuit equipment expense. 32.6232 Section 32... SYSTEM OF ACCOUNTS FOR TELECOMMUNICATIONS COMPANIES Instructions for Expense Accounts § 32.6232 Circuit...

47 CFR 32.6232 - Circuit equipment expense.

Code of Federal Regulations, 2010 CFR

2010-10-01

...) This subaccount 6232.1 Electronic shall include expenses associated with electronic circuit equipment... 47 Telecommunication 2 2010-10-01 2010-10-01 false Circuit equipment expense. 32.6232 Section 32... SYSTEM OF ACCOUNTS FOR TELECOMMUNICATIONS COMPANIES Instructions for Expense Accounts § 32.6232 Circuit...

47 CFR 32.6232 - Circuit equipment expense.

Code of Federal Regulations, 2014 CFR

2014-10-01

...) This subaccount 6232.1 Electronic shall include expenses associated with electronic circuit equipment... 47 Telecommunication 2 2014-10-01 2014-10-01 false Circuit equipment expense. 32.6232 Section 32... SYSTEM OF ACCOUNTS FOR TELECOMMUNICATIONS COMPANIES Instructions for Expense Accounts § 32.6232 Circuit...

RF tuning element

NASA Technical Reports Server (NTRS)

McGrath, William R. (Inventor); Lubecke, Victor M. (Inventor)

1992-01-01

A device for tuning a circuit includes a substrate, a transmission line on the substrate that includes first and second conductors coupled to a circuit to be tuned, and a movable short-circuit for varying the impedance the transmission line presents to the circuit to be tuned. The movable short-circuit includes a dielectric layer disposed atop the transmission line and a distributed shorting element in the form of a conductive member that is configured to be slid along at least a portion of the transmission line atop the dielectric layer. The conductive member is configured to span the first and second conductors of the transmission line and to define at least a first opening that spans the two conductors so that the conductive member includes first and second sections separated by the first opening. The first and second sections of the conductive member combine with the first and second conductors of the transmission line to form first and second low impedance sections of transmission line, and the opening combines with the first and second conductors of the transmission line and the dielectric layer to form a first high impedance section of transmission line intermediate the first and second low impedance sections. Each of the first low impedance section and the first high impedance section have a length along the transmission line of approximately one-quarter wavelength, thus providing a periodic variation of transmission line impedance. That enhances reflection of rf power.

30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2010 CFR

2010-07-01

... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits...

49 CFR 236.722 - Circuit, cut-in.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Circuit, cut-in. 236.722 Section 236.722 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, cut-in. A roadway circuit at the entrance to automatic train stop, train control or cab signal...

30 CFR 57.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Abandoned electric circuits. 57.4011 Section 57.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... and Control § 57.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized...

30 CFR 56.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Abandoned electric circuits. 56.4011 Section 56.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... Control § 56.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized and...

30 CFR 57.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Abandoned electric circuits. 57.4011 Section 57.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... and Control § 57.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized...

30 CFR 56.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Abandoned electric circuits. 56.4011 Section 56.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... Control § 56.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized and...

30 CFR 57.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Abandoned electric circuits. 57.4011 Section 57.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... and Control § 57.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized...

30 CFR 56.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Abandoned electric circuits. 56.4011 Section 56.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... Control § 56.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized and...

30 CFR 56.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Abandoned electric circuits. 56.4011 Section 56.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... Control § 56.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized and...

30 CFR 57.4011 - Abandoned electric circuits.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Abandoned electric circuits. 57.4011 Section 57.4011 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL... and Control § 57.4011 Abandoned electric circuits. Abandoned electric circuits shall be deenergized...

49 CFR 236.722 - Circuit, cut-in.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, cut-in. 236.722 Section 236.722 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, cut-in. A roadway circuit at the entrance to automatic train stop, train control or cab signal...

49 CFR 236.103 - Switch circuit controller or point detector.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Switch circuit controller or point detector. 236.103 Section 236.103 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL... controller or point detector. Switch circuit controller, circuit controller, or point detector operated by...

49 CFR 236.103 - Switch circuit controller or point detector.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Switch circuit controller or point detector. 236.103 Section 236.103 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL... controller or point detector. Switch circuit controller, circuit controller, or point detector operated by...

49 CFR 236.103 - Switch circuit controller or point detector.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Switch circuit controller or point detector. 236.103 Section 236.103 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL... controller or point detector. Switch circuit controller, circuit controller, or point detector operated by...

49 CFR 236.103 - Switch circuit controller or point detector.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Switch circuit controller or point detector. 236.103 Section 236.103 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL... controller or point detector. Switch circuit controller, circuit controller, or point detector operated by...

49 CFR 236.103 - Switch circuit controller or point detector.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Switch circuit controller or point detector. 236.103 Section 236.103 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL... controller or point detector. Switch circuit controller, circuit controller, or point detector operated by...

47 CFR 2.925 - Identification of equipment.

Code of Federal Regulations, 2014 CFR

2014-10-01

... sections assembled in a common enclosure, on a common chassis or circuit board, and with common frequency controlling circuits. Devices to which a single FCC Identifier has been assigned shall be identified pursuant... circuit boards with independent frequency controlling circuits. The FCC Identifier assigned to any...

47 CFR 2.925 - Identification of equipment.

Code of Federal Regulations, 2011 CFR

2011-10-01

... common chassis or circuit board, and with common frequency controlling circuits. Devices to which a... common enclosure, but constructed on separate sub-units or circuit boards with independent frequency controlling circuits. The FCC Identifier assigned to any transmitter section shall be preceded by the term TX...

47 CFR 2.925 - Identification of equipment.

Code of Federal Regulations, 2013 CFR

2013-10-01

... common chassis or circuit board, and with common frequency controlling circuits. Devices to which a... common enclosure, but constructed on separate sub-units or circuit boards with independent frequency controlling circuits. The FCC Identifier assigned to any transmitter section shall be preceded by the term TX...

47 CFR 2.925 - Identification of equipment.

Code of Federal Regulations, 2012 CFR

2012-10-01

... common chassis or circuit board, and with common frequency controlling circuits. Devices to which a... common enclosure, but constructed on separate sub-units or circuit boards with independent frequency controlling circuits. The FCC Identifier assigned to any transmitter section shall be preceded by the term TX...

47 CFR 2.925 - Identification of equipment.

Code of Federal Regulations, 2010 CFR

2010-10-01

... common chassis or circuit board, and with common frequency controlling circuits. Devices to which a... common enclosure, but constructed on separate sub-units or circuit boards with independent frequency controlling circuits. The FCC Identifier assigned to any transmitter section shall be preceded by the term TX...

A System for Controlling the Oxygen Content of a Gas Produced by Combustion

NASA Technical Reports Server (NTRS)

Singh, J. J.; Davis, W. T.; Puster, R. L. (Inventor)

1984-01-01

A mixture of air, CH4 and OH(2) is burned in a combustion chamber to produce a product gas in the test section. The OH(2) content of the product gas is compared with the OH(2) content of reference air in an OH(2) sensor. If there is a difference an error signal is produced at the output of a control circuit which by the means of a solenoid valve, regulates the flow of OH(2) into the combustion chamber to make the error signal zero. The product gas in the test section has the same oxygen content as air.

42 CFR 84.96 - Service time test; closed-circuit apparatus.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to the...

42 CFR 84.96 - Service time test; closed-circuit apparatus.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; closed-circuit apparatus. 84.96...-Contained Breathing Apparatus § 84.96 Service time test; closed-circuit apparatus. (a) The closed-circuit apparatus will be classified according to the length of time it supplies adequate breathing gas to the...

Operating envelope charts for the Langley 0.3-meter transonic cryogenic wind tunnel

NASA Technical Reports Server (NTRS)

Rallo, R. A.; Dress, D. A.; Siegle, H. J. A.

1986-01-01

To take full advantage of the unique Reynolds number capabilities of the 0.3-meter Transonic Cryogenic Tunnel (0.3-m TCT) at the NASA Langley Research Center, it was designed to accommodate test sections other than the original, octagonal, three-dimensional test section. A 20- by 60-cm two-dimensional test section was installed in 1976 and was extensively used, primarily for airfoil testing, through the fall of 1984. The tunnel was inactive during 1985 so that a new test section and improved high speed diffuser could be installed in the tunnel circuit. The new test section has solid adaptive top and bottom walls to reduce or eliminate wall interference for two-dimensional testing. The test section is 33- by 33-cm in cross section at the entrance and is 142 cm long. In the planning and running of past airfoil tests in the 0.3-m TCT, the use of operating envelope charts have proven very useful. These charts give the variation of total temperature and pressure with Mach number and Reynolds number. The operating total temperature range of the 0.3-m TCT is from about 78 K to 327 K with total pressures ranging from about 17.5 psia to 88 psia. This report presents the operating envelope charts for the 0.3-m TCT with the adaptive wall tes t section installed. They were all generated based on a 1-foot chord model. The Mach numbers vary from 0.1 to 0.95.

30 CFR 56.6403 - Branch circuits.

Code of Federal Regulations, 2010 CFR

2010-07-01

... SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Explosives Electric Blasting § 56.6403 Branch circuits. (a) If electric blasting includes the use of branch circuits, each... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Branch circuits. 56.6403 Section 56.6403...

30 CFR 57.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2010 CFR

2010-07-01

... Electricity Surface and Underground § 57.12025 Grounding circuit enclosures. All metal enclosing or encasing electrical circuits shall be grounded or provided with equivalent protection. This requirement does not apply... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Grounding circuit enclosures. 57.12025 Section...

30 CFR 77.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Identification of circuit breakers and disconnecting switches. 77.809 Section 77.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuit breakers and disconnecting switches. Circuit breakers and disconnecting switches shall be labeled...

30 CFR 77.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Identification of circuit breakers and disconnecting switches. 77.809 Section 77.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuit breakers and disconnecting switches. Circuit breakers and disconnecting switches shall be labeled...

30 CFR 77.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Identification of circuit breakers and disconnecting switches. 77.809 Section 77.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuit breakers and disconnecting switches. Circuit breakers and disconnecting switches shall be labeled...

30 CFR 77.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Identification of circuit breakers and disconnecting switches. 77.809 Section 77.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuit breakers and disconnecting switches. Circuit breakers and disconnecting switches shall be labeled...

30 CFR 77.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Identification of circuit breakers and disconnecting switches. 77.809 Section 77.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuit breakers and disconnecting switches. Circuit breakers and disconnecting switches shall be labeled...

High level radioactive waste vitrification process equipment component testing

NASA Astrophysics Data System (ADS)

Siemens, D. H.; Health, W. C.; Larson, D. E.; Craig, S. N.; Berger, D. N.; Goles, R. W.

1985-04-01

Remote operability and maintainability of vitrification equipment were assessment under shielded cell conditions. The equipment tested will be applied to immobilize high level and transuranic liquid waste slurries that resulted from plutonium production for defense weapons. Equipment tested included: a turntable for handling waste canisters under the melter; a removable discharge cone in the melter overflow section; a thermocouple jumper that extends into a shielded cell; remote instrument and electrical connectors; remote, mechanical, and heat transfer aspects of the melter glass overflow section; a reamer to clean out plugged nozzles in the melter top; a closed circuit camera to view the melter interior; and a device to retrieve samples of the glass product. A test was also conduucted to evaluate liquid metals for use in a liquid metal sealing system.

Flow Quality Studies of the NASA Glenn Research Center Icing Research Tunnel Circuit (1995 Tests)

NASA Technical Reports Server (NTRS)

Arrington, E. Allen; Kee-Bowling, Bonnie A.; Gonsalez, Jose C.

2000-01-01

The purpose of conducting the flow-field surveys described in this report was to more fully document the flow quality in several areas of the tunnel circuit in the NASA Glenn Research Center Icing Research Tunnel. The results from these surveys provide insight into areas of the tunnel that were known to exhibit poor flow quality characteristics and provide data that will be useful to the design of flow quality improvements and a new heat exchanger for the facility. An instrumented traversing mechanism was used to survey the flow field at several large cross sections of the tunnel loop over the entire speed range of the facility. Flow-field data were collected at five stations in the tunnel loop, including downstream of the fan drive motor housing, upstream and downstream of the heat exchanger, and upstream and downstream of the spraybars located in the settling chamber upstream of the test section. The data collected during these surveys greatly expanded the data base describing the flow quality in each of these areas. The new data matched closely the flow quality trends recorded from earlier tests. Data collected downstream of the heat exchanger and in the settling chamber showed how the configuration of the folded heat exchanger affected the pressure, velocity, and flow angle distributions in these areas. Smoke flow visualization was also used to qualitatively study the flow field in an area downstream of the drive fan and in the settling chamber/contraction section.

30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

Code of Federal Regulations, 2010 CFR

2010-07-01

... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

46 CFR 111.55-3 - Circuit connections.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 46 Shipping 4 2011-10-01 2011-10-01 false Circuit connections. 111.55-3 Section 111.55-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switches § 111.55-3 Circuit connections. The load side of each circuit must be connected to the...

46 CFR 111.55-3 - Circuit connections.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 46 Shipping 4 2012-10-01 2012-10-01 false Circuit connections. 111.55-3 Section 111.55-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switches § 111.55-3 Circuit connections. The load side of each circuit must be connected to the...

46 CFR 111.55-3 - Circuit connections.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 4 2010-10-01 2010-10-01 false Circuit connections. 111.55-3 Section 111.55-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switches § 111.55-3 Circuit connections. The load side of each circuit must be connected to the...

46 CFR 111.55-3 - Circuit connections.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 46 Shipping 4 2013-10-01 2013-10-01 false Circuit connections. 111.55-3 Section 111.55-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switches § 111.55-3 Circuit connections. The load side of each circuit must be connected to the...

46 CFR 111.55-3 - Circuit connections.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 46 Shipping 4 2014-10-01 2014-10-01 false Circuit connections. 111.55-3 Section 111.55-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switches § 111.55-3 Circuit connections. The load side of each circuit must be connected to the...

49 CFR 236.201 - Track-circuit control of signals.

Code of Federal Regulations, 2011 CFR

2011-10-01

..., INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Automatic Block Signal Systems Standards § 236.201 Track-circuit control of signals. The control circuits for home... 49 Transportation 4 2011-10-01 2011-10-01 false Track-circuit control of signals. 236.201 Section...

49 CFR 236.201 - Track-circuit control of signals.

Code of Federal Regulations, 2010 CFR

2010-10-01

..., INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Automatic Block Signal Systems Standards § 236.201 Track-circuit control of signals. The control circuits for home... 49 Transportation 4 2010-10-01 2010-10-01 false Track-circuit control of signals. 236.201 Section...

46 CFR 111.75-5 - Lighting branch circuits.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 4 2010-10-01 2010-10-01 false Lighting branch circuits. 111.75-5 Section 111.75-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Lighting Circuits and Protection § 111.75-5 Lighting branch circuits. (a) Loads. A...

21 CFR 868.5240 - Anesthesia breathing circuit.

Code of Federal Regulations, 2011 CFR

2011-04-01

... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Anesthesia breathing circuit. 868.5240 Section 868...) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5240 Anesthesia breathing circuit. (a) Identification. An anesthesia breathing circuit is a device that is intended to administer medical gases to a...

21 CFR 868.5240 - Anesthesia breathing circuit.

Code of Federal Regulations, 2010 CFR

2010-04-01

... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Anesthesia breathing circuit. 868.5240 Section 868...) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5240 Anesthesia breathing circuit. (a) Identification. An anesthesia breathing circuit is a device that is intended to administer medical gases to a...

30 CFR 75.802 - Protection of high-voltage circuits extending underground.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

30 CFR 75.802 - Protection of high-voltage circuits extending underground.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

30 CFR 75.802 - Protection of high-voltage circuits extending underground.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

49 CFR 236.721 - Circuit, control.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Circuit, control. 236.721 Section 236.721..., MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Definitions § 236.721 Circuit, control. An electrical circuit between a source of electric energy and a device which it operates. ...

49 CFR 236.721 - Circuit, control.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 49 Transportation 4 2011-10-01 2011-10-01 false Circuit, control. 236.721 Section 236.721..., MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Definitions § 236.721 Circuit, control. An electrical circuit between a source of electric energy and a device which it operates. ...

49 CFR 236.721 - Circuit, control.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Circuit, control. 236.721 Section 236.721..., MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Definitions § 236.721 Circuit, control. An electrical circuit between a source of electric energy and a device which it operates. ...

49 CFR 236.721 - Circuit, control.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, control. 236.721 Section 236.721..., MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Definitions § 236.721 Circuit, control. An electrical circuit between a source of electric energy and a device which it operates. ...

30 CFR 75.800-2 - Approved circuit schemes.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Approved circuit schemes. 75.800-2 Section 75.800-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... § 75.800-2 Approved circuit schemes. The following circuit schemes will be regarded as providing the...

30 CFR 75.800-2 - Approved circuit schemes.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Approved circuit schemes. 75.800-2 Section 75.800-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... § 75.800-2 Approved circuit schemes. The following circuit schemes will be regarded as providing the...

30 CFR 75.800-2 - Approved circuit schemes.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Approved circuit schemes. 75.800-2 Section 75.800-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... § 75.800-2 Approved circuit schemes. The following circuit schemes will be regarded as providing the...

21 CFR 868.5240 - Anesthesia breathing circuit.

Code of Federal Regulations, 2014 CFR

2014-04-01

... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Anesthesia breathing circuit. 868.5240 Section 868...) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5240 Anesthesia breathing circuit. (a) Identification. An anesthesia breathing circuit is a device that is intended to administer medical gases to a...

DOE Office of Scientific and Technical Information (OSTI.GOV)

None, None

The multi-agent system (MAS) approach has been applied with promising results for enhancing an electric power distribution circuit, such as the Circuit of the Future as developed by Southern California Edison. These next generation power system results include better ability to reconfigure the circuit as well as the increased capability to improve the protection and enhance the reliability of the circuit. There were four main tasks in this project. The specific results for each of these four tasks and their related topics are presented in main sections of this report. Also, there were seven deliverables for this project. The mainmore » conclusions for these deliverables are summarized in the identified subtask section of this report. The specific details for each of these deliverables are included in the “Project Deliverables” section at the end of this Final Report.« less

76 FR 9374 - Proposed Extension of Existing Information Collection; Examinations and Testing of Electrical...

Federal Register 2010, 2011, 2012, 2013, 2014

2011-02-17

... related detached components; 75.800-4 Testing, examination and maintenance of circuit breakers; record; 75...-4 Testing, examination and maintenance of circuit breakers; record; 75.1001-1 Devices for..., testing, and maintenance; 77.800-2 Testing, examination and maintenance of circuit breakers; record; and...

42 CFR 84.95 - Service time test; open-circuit apparatus.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 42 Public Health 1 2011-10-01 2011-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be...

42 CFR 84.95 - Service time test; open-circuit apparatus.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 42 Public Health 1 2010-10-01 2010-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be measured with a breathing machine as described in § 84.88. (b) The open-circuit apparatus will be...

Capacitive charge generation apparatus and method for testing circuits

DOEpatents

Cole, E.I. Jr.; Peterson, K.A.; Barton, D.L.

1998-07-14

An electron beam apparatus and method for testing a circuit are disclosed. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 {micro}m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits. 7 figs.

Capacitive charge generation apparatus and method for testing circuits

DOEpatents

Cole, Jr., Edward I.; Peterson, Kenneth A.; Barton, Daniel L.

1998-01-01

An electron beam apparatus and method for testing a circuit. The electron beam apparatus comprises an electron beam incident on an outer surface of an insulating layer overlying one or more electrical conductors of the circuit for generating a time varying or alternating current electrical potential on the surface; and a measurement unit connected to the circuit for measuring an electrical signal capacitively coupled to the electrical conductors to identify and map a conduction state of each of the electrical conductors, with or without an electrical bias signal being applied to the circuit. The electron beam apparatus can further include a secondary electron detector for forming a secondary electron image for registration with a map of the conduction state of the electrical conductors. The apparatus and method are useful for failure analysis or qualification testing to determine the presence of any open-circuits or short-circuits, and to verify the continuity or integrity of electrical conductors buried below an insulating layer thickness of 1-100 .mu.m or more without damaging or breaking down the insulating layer. The types of electrical circuits that can be tested include integrated circuits, multi-chip modules, printed circuit boards and flexible printed circuits.

In-line Microwave Warmer for Blood and Intravenous Fluids.

DTIC Science & Technology

1989-12-14

circuit was designed and tested. This circuit uses a digitally controlled optically coupled Triac , a thyristor device, which acts as a switch to allow...three sites of the circuit : Inlet Port of Heating Chamber Interior Path of Heating Chamber Outlet Port of Heating Chamber 4) Feedback Control Mechanism...accomplished through use of a closed loop test circuit depicted in Figure 1-2. This test circuit can be used to heat iv fluids or blood on a continuous

Functional test generation for digital circuits described with a declarative language: LUSTRE

NASA Astrophysics Data System (ADS)

Almahrous, Mazen

1990-08-01

A functional approach to the test generation problem starting from a high level description is proposed. The circuit tested is modeled, using the LUSTRE high level data flow description language. The different LUSTRE primitives are translated to a SATAN format graph in order to evaluate the testability of the circuit and to generate test sequences. Another method of testing the complex circuits comprising an operative part and a control part is defined. It consists of checking experiments for the control part observed through the operative part. It was applied to the automata generated from a LUSTRE description of the circuit.

Equivalent circuit and optimum design of a multilayer laminated piezoelectric transformer.

PubMed

Dong, Shuxiang; Carazo, Alfredo Vazquez; Park, Seung Ho

2011-12-01

A multilayer laminated piezoelectric Pb(Zr(1-x)Ti(x))O(3) (PZT) ceramic transformer, operating in a half- wavelength longitudinal resonant mode (λ/2 mode), has been analyzed. This piezoelectric transformer is composed of one thickness-polarized section (T-section) for exciting the longitudinal mechanical vibrations, two longitudinally polarized sections (L-section) for generating high-voltage output, and two insulating layers laminated between the T-section and L-section layers to provide insulation between the input and output sections. Based on the piezoelectric constitutive and motion equations, an electro-elasto-electric (EEE) equivalent circuit has been developed, and correspondingly, an effective EEE coupling coefficient was proposed for optimum design of this multilayer transformer. Commercial finite element analysis software is used to determine the validity of the developed equivalent circuit. Finally, a prototype sample was manufactured and experimental data was collected to verify the model's validity.

Delay test generation for synchronous sequential circuits

NASA Astrophysics Data System (ADS)

Devadas, Srinivas

1989-05-01

We address the problem of generating tests for delay faults in non-scan synchronous sequential circuits. Delay test generation for sequential circuits is a considerably more difficult problem than delay testing of combinational circuits and has received much less attention. In this paper, we present a method for generating test sequences to detect delay faults in sequential circuits using the stuck-at fault sequential test generator STALLION. The method is complete in that it will generate a delay test sequence for a targeted fault given sufficient CPU time, if such a sequence exists. We term faults for which no delay test sequence exists, under out test methodology, sequentially delay redundant. We describe means of eliminating sequential delay redundancies in logic circuits. We present a partial-scan methodology for enhancing the testability of difficult-to-test of untestable sequential circuits, wherein a small number of flip-flops are selected and made controllable/observable. The selection process guarantees the elimination of all sequential delay redundancies. We show that an intimate relationship exists between state assignment and delay testability of a sequential machine. We describe a state assignment algorithm for the synthesis of sequential machines with maximal delay fault testability. Preliminary experimental results using the test generation, partial-scan and synthesis algorithm are presented.

High density electronic circuit and process for making

DOEpatents

Morgan, William P.

1999-01-01

High density circuits with posts that protrude beyond one surface of a substrate to provide easy mounting of devices such as integrated circuits. The posts also provide stress relief to accommodate differential thermal expansion. The process allows high interconnect density with fewer alignment restrictions and less wasted circuit area than previous processes. The resulting substrates can be test platforms for die testing and for multi-chip module substrate testing. The test platform can contain active components and emulate realistic operational conditions, replacing shorts/opens net testing.

NASA Dryden flow visualization facility

NASA Technical Reports Server (NTRS)

Delfrate, John H.

1995-01-01

This report describes the Flow Visualization Facility at NASA Dryden Flight Research Center, Edwards, California. This water tunnel facility is used primarily for visualizing and analyzing vortical flows on aircraft models and other shapes at high-incidence angles. The tunnel is used extensively as a low-cost, diagnostic tool to help engineers understand complex flows over aircraft and other full-scale vehicles. The facility consists primarily of a closed-circuit water tunnel with a 16- x 24-in. vertical test section. Velocity of the flow through the test section can be varied from 0 to 10 in/sec; however, 3 in/sec provides optimum velocity for the majority of flow visualization applications. This velocity corresponds to a unit Reynolds number of 23,000/ft and a turbulence level over the majority of the test section below 0.5 percent. Flow visualization techniques described here include the dye tracer, laser light sheet, and shadowgraph. Limited correlation to full-scale flight data is shown.

46 CFR 169.690 - Lighting branch circuits.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 7 2010-10-01 2010-10-01 false Lighting branch circuits. 169.690 Section 169.690... Machinery and Electrical Electrical Installations on Vessels of 100 Gross Tons and Over § 169.690 Lighting branch circuits. Each lighting branch circuit must meet the requirements of § 111.75-5 of this chapter...

30 CFR 77.900 - Low- and medium-voltage circuits serving portable or mobile three-phase alternating current...

Code of Federal Regulations, 2011 CFR

2011-07-01

... portable or mobile three-phase alternating current equipment; circuit breakers. 77.900 Section 77.900... mobile three-phase alternating current equipment; circuit breakers. Low- and medium-voltage circuits supplying power to portable or mobile three-phase alternating current equipment shall be protected by...

49 CFR 234.237 - Reverse switch cut-out circuit.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 49 Transportation 4 2013-10-01 2013-10-01 false Reverse switch cut-out circuit. 234.237 Section....237 Reverse switch cut-out circuit. A switch, when equipped with a switch circuit controller connected... warning system can only be cut out when the switch point is within one-half inch of full reverse position. ...

49 CFR 234.237 - Reverse switch cut-out circuit.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 49 Transportation 4 2014-10-01 2014-10-01 false Reverse switch cut-out circuit. 234.237 Section....237 Reverse switch cut-out circuit. A switch, when equipped with a switch circuit controller connected... warning system can only be cut out when the switch point is within one-half inch of full reverse position. ...

49 CFR 234.237 - Reverse switch cut-out circuit.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 49 Transportation 4 2012-10-01 2012-10-01 false Reverse switch cut-out circuit. 234.237 Section....237 Reverse switch cut-out circuit. A switch, when equipped with a switch circuit controller connected... warning system can only be cut out when the switch point is within one-half inch of full reverse position. ...

30 CFR 57.12017 - Work on power circuits.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Work on power circuits. 57.12017 Section 57... Surface and Underground § 57.12017 Work on power circuits. Power circuits shall be deenergized before work... the individuals who are to do the work. Switches shall be locked out or other measures taken which...

30 CFR 77.902-1 - Fail safe ground check circuits; maximum voltage.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Fail safe ground check circuits; maximum voltage. 77.902-1 Section 77.902-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... ground check circuits; maximum voltage. The maximum voltage used for ground check circuits under § 77.902...

30 CFR 77.902-1 - Fail safe ground check circuits; maximum voltage.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Fail safe ground check circuits; maximum voltage. 77.902-1 Section 77.902-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... ground check circuits; maximum voltage. The maximum voltage used for ground check circuits under § 77.902...

30 CFR 75.803-1 - Maximum voltage ground check circuits.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Maximum voltage ground check circuits. 75.803-1 Section 75.803-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE... § 75.803-1 Maximum voltage ground check circuits. The maximum voltage used for ground check circuits...

30 CFR 75.803-1 - Maximum voltage ground check circuits.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Maximum voltage ground check circuits. 75.803-1 Section 75.803-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE... § 75.803-1 Maximum voltage ground check circuits. The maximum voltage used for ground check circuits...

Certification of highly complex safety-related systems.

PubMed

Reinert, D; Schaefer, M

1999-01-01

The BIA has now 15 years of experience with the certification of complex electronic systems for safety-related applications in the machinery sector. Using the example of machining centres this presentation will show the systematic procedure for verifying and validating control systems using Application Specific Integrated Circuits (ASICs) and microcomputers for safety functions. One section will describe the control structure of machining centres with control systems using "integrated safety." A diverse redundant architecture combined with crossmonitoring and forced dynamization is explained. In the main section the steps of the systematic certification procedure are explained showing some results of the certification of drilling machines. Specification reviews, design reviews with test case specification, statistical analysis, and walk-throughs are the analytical measures in the testing process. Systematic tests based on the test case specification, Electro Magnetic Interference (EMI), and environmental testing, and site acceptance tests on the machines are the testing measures for validation. A complex software driven system is always undergoing modification. Most of the changes are not safety-relevant but this has to be proven. A systematic procedure for certifying software modifications is presented in the last section of the paper.

Flow behavior in the Wright Brothers Facility

NASA Technical Reports Server (NTRS)

Genn, S.

1984-01-01

It has become increasingly apparent that a reexamination of the flow characteristics in the low speed Wright Brothers Facility (WBF) is of some importance in view of recent improvements in the precision of the data acquisition system. In particular, the existence of local regions of separation, if any, in back portions of the circuit, and possible related unsteadiness, are of interest. Observations from that initial experiment did indicate some unsteady air flow problems in the cross leg, and thereafter the test region (Section A) was calibrated quantitatively. The intent was to learn something about the effect of upstream intermittent behavior flow on the test section flow, as well as to provide an extensive calibration as a standard for the effects induced by future alteration of the tunnel. Distributions of total pressure coefficients were measured first at one cross-section plane of the test section, namely the model station. Data were obtained for several tunnel speeds. The reduced data yielded an unexpected distribution involving larger pressures along the inside wall.

Split-cross-bridge resistor for testing for proper fabrication of integrated circuits

NASA Technical Reports Server (NTRS)

Buehler, M. G. (Inventor)

1985-01-01

An electrical testing structure and method is described whereby a test structure is fabricated on a large scale integrated circuit wafer along with the circuit components and has a van der Pauw cross resistor in conjunction with a bridge resistor and a split bridge resistor, the latter having two channels each a line width wide, corresponding to the line width of the wafer circuit components, and with the two channels separated by a space equal to the line spacing of the wafer circuit components. The testing structure has associated voltage and current contact pads arranged in a two by four array for conveniently passing currents through the test structure and measuring voltages at appropriate points to calculate the sheet resistance, line width, line spacing, and line pitch of the circuit components on the wafer electrically.

Product assurance technology for custom LSI/VLSI electronics

NASA Technical Reports Server (NTRS)

Buehler, M. G.; Blaes, B. R.; Jennings, G. A.; Moore, B. T.; Nixon, R. H.; Pina, C. A.; Sayah, H. R.; Sievers, M. W.; Stahlberg, N. F.

1985-01-01

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification.

High density electronic circuit and process for making

DOEpatents

Morgan, W.P.

1999-06-29

High density circuits with posts that protrude beyond one surface of a substrate to provide easy mounting of devices such as integrated circuits are disclosed. The posts also provide stress relief to accommodate differential thermal expansion. The process allows high interconnect density with fewer alignment restrictions and less wasted circuit area than previous processes. The resulting substrates can be test platforms for die testing and for multi-chip module substrate testing. The test platform can contain active components and emulate realistic operational conditions, replacing shorts/opens net testing. 8 figs.

Cooling system for removing metabolic heat from an hermetically sealed spacesuit

NASA Technical Reports Server (NTRS)

Webbon, B. W.; Vykukal, H. C.; Williams, B. A. (Inventor)

1978-01-01

An improved cooling and ventilating system is described for removing metabolic heat, waste gases and water vapor generated by a wearer of an hermetically sealed spacesuit. The cooling system was characterized by a body suit, having a first circuit for simultaneously establishing a cooling flow of water through the thorax and head sections of the body suit. Circulation patches were included mounted in the thorax section and head section of the body suit. A second circuit for discharing a flow of gas throughout the spacesuit and a disconnect unit for coupling the circuits with a life support system externally related to the spacesuit were provided.

46 CFR 169.672 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 46 Shipping 7 2013-10-01 2013-10-01 false Wiring for power and lighting circuits. 169.672 Section... Volts on Vessels of Less Than 100 Gross Tons § 169.672 Wiring for power and lighting circuits. (a) Wiring for power and lighting circuits must have copper conductors, of 14 AWG or larger, and— (1) Meet...

46 CFR 169.672 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 46 Shipping 7 2014-10-01 2014-10-01 false Wiring for power and lighting circuits. 169.672 Section... Volts on Vessels of Less Than 100 Gross Tons § 169.672 Wiring for power and lighting circuits. (a) Wiring for power and lighting circuits must have copper conductors, of 14 AWG or larger, and— (1) Meet...

30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

TV Trouble-Shooting Manual. Volumes 15-16. Part 7: Power-Supply Circuit. Student and Instructor's Manuals.

ERIC Educational Resources Information Center

Mukai, Masaaki; Kobayashi, Ryozo

These volumes are, respectively, the self-instructional student manual and the teacher manual that cover the seventh set of training topics in this course for television repair technicians. Both contain identical information on the television power supply circuit, including sections on the rectifier circuit and the voltage regulator circuit.…

33 CFR 183.430 - Conductors in circuits of less than 50 volts.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 33 Navigation and Navigable Waters 2 2011-07-01 2011-07-01 false Conductors in circuits of less... Requirements § 183.430 Conductors in circuits of less than 50 volts. (a) Each conductor in a circuit that has a... Standard 1128. (b) This section does not apply to communication systems; electronic navigation equipment...

33 CFR 183.430 - Conductors in circuits of less than 50 volts.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 33 Navigation and Navigable Waters 2 2012-07-01 2012-07-01 false Conductors in circuits of less... Requirements § 183.430 Conductors in circuits of less than 50 volts. (a) Each conductor in a circuit that has a... Standard 1128. (b) This section does not apply to communication systems; electronic navigation equipment...

33 CFR 183.430 - Conductors in circuits of less than 50 volts.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 33 Navigation and Navigable Waters 2 2010-07-01 2010-07-01 false Conductors in circuits of less... Requirements § 183.430 Conductors in circuits of less than 50 volts. (a) Each conductor in a circuit that has a... Standard 1128. (b) This section does not apply to communication systems; electronic navigation equipment...

33 CFR 183.430 - Conductors in circuits of less than 50 volts.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 33 Navigation and Navigable Waters 2 2014-07-01 2014-07-01 false Conductors in circuits of less... Requirements § 183.430 Conductors in circuits of less than 50 volts. (a) Each conductor in a circuit that has a... Standard 1128. (b) This section does not apply to communication systems; electronic navigation equipment...

33 CFR 183.430 - Conductors in circuits of less than 50 volts.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 33 Navigation and Navigable Waters 2 2013-07-01 2013-07-01 false Conductors in circuits of less... Requirements § 183.430 Conductors in circuits of less than 50 volts. (a) Each conductor in a circuit that has a... Standard 1128. (b) This section does not apply to communication systems; electronic navigation equipment...

Solid State Technology Branch of NASA Lewis Research Center Second Annual Digest, June 1989 - June 1990

NASA Technical Reports Server (NTRS)

1990-01-01

A collection of papers and presentations authored by the branch between June 1989 and June 1990 is presented. The papers are organized into four sections. Section 1 deals with research in microwave circuits and includes full integrated circuits, the demonstration of optical/RF interfaces, and the evaluation of some hybrid circuitry. Section 2 indicates developments in coplanar waveguides and their use in breadboard circuits. Section 3 addresses high temperature superconductivity and includes: thin film deposition, transport measurement of film characteristics, RF surface resistant measurements, substrate permittivity measurements, measurements of microstrip line characteristics at cryogenic temperatures, patterning of superconducting films, and evaluation of simple passive microstrip circuitry based on YBaCuO films. Section 4 deals with carbon films, silicon carbide, GaAs/AlGaAs, HgCdTe, and other materials.

BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability. Ph.D. Thesis

NASA Technical Reports Server (NTRS)

Chen, Chung-Hsing

1992-01-01

In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

Traveling-Wave Tube Cold-Test Circuit Optimization Using CST MICROWAVE STUDIO

NASA Technical Reports Server (NTRS)

Chevalier, Christine T.; Kory, Carol L.; Wilson, Jeffrey D.; Wintucky, Edwin G.; Dayton, James A., Jr.

2003-01-01

The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of Microwave Studio to TWT cold-test circuit optimization is described.

Digital transmitter for data bus communications system

NASA Technical Reports Server (NTRS)

Proch, G. E.

1974-01-01

Digital transmitter designed for Manchester coded signals (and all signals with ac waveforms) generated at a rate of one megabit per second includes efficient output isolation circuit. Transmitter consists of logic control section, amplifier, and output isolation section. Output isolation circuit provides dynamic impedance at terminals as function of amplifier output level.

Passive Resonant Bidirectional Converter with Galvanic Barrier

NASA Technical Reports Server (NTRS)

Rosenblad, Nathan S. (Inventor)

2014-01-01

A passive resonant bidirectional converter system that transports energy across a galvanic barrier includes a converter using at least first and second converter sections, each section including a pair of transfer terminals, a center tapped winding; a chopper circuit interconnected between the center tapped winding and one of the transfer terminals; an inductance feed winding interconnected between the other of the transfer terminals and the center tap and a resonant tank circuit including at least the inductance of the center tap winding and the parasitic capacitance of the chopper circuit for operating the converter section at resonance; the center tapped windings of the first and second converter sections being disposed on a first common winding core and the inductance feed windings of the first and second converter sections being disposed on a second common winding core for automatically synchronizing the resonant oscillation of the first and second converter sections and transferring energy between the converter sections until the voltage across the pairs of transfer terminals achieves the turns ratio of the center tapped windings.

30 CFR 75.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2012 CFR

2012-07-01

... disconnecting switches. 75.809 Section 75.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.809 Identification of circuit breakers and disconnecting switches. [Statutory Provisions] Circuit breakers and disconnecting switches underground shall be marked for...

30 CFR 75.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2010 CFR

2010-07-01

... disconnecting switches. 75.809 Section 75.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.809 Identification of circuit breakers and disconnecting switches. [Statutory Provisions] Circuit breakers and disconnecting switches underground shall be marked for...

30 CFR 75.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2011 CFR

2011-07-01

... disconnecting switches. 75.809 Section 75.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.809 Identification of circuit breakers and disconnecting switches. [Statutory Provisions] Circuit breakers and disconnecting switches underground shall be marked for...

30 CFR 75.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2013 CFR

2013-07-01

... disconnecting switches. 75.809 Section 75.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.809 Identification of circuit breakers and disconnecting switches. [Statutory Provisions] Circuit breakers and disconnecting switches underground shall be marked for...

30 CFR 75.809 - Identification of circuit breakers and disconnecting switches.

Code of Federal Regulations, 2014 CFR

2014-07-01

... disconnecting switches. 75.809 Section 75.809 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... High-Voltage Distribution § 75.809 Identification of circuit breakers and disconnecting switches. [Statutory Provisions] Circuit breakers and disconnecting switches underground shall be marked for...

48 CFR 225.7006 - Restriction on air circuit breakers for naval vessels.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 48 Federal Acquisition Regulations System 3 2011-10-01 2011-10-01 false Restriction on air circuit breakers for naval vessels. 225.7006 Section 225.7006 Federal Acquisition Regulations System DEFENSE... on air circuit breakers for naval vessels. ...

48 CFR 225.7006 - Restriction on air circuit breakers for naval vessels.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 48 Federal Acquisition Regulations System 3 2010-10-01 2010-10-01 false Restriction on air circuit breakers for naval vessels. 225.7006 Section 225.7006 Federal Acquisition Regulations System DEFENSE... on air circuit breakers for naval vessels. ...

An electronic circuit for sensing malfunctions in test instrumentation

NASA Technical Reports Server (NTRS)

Miller, W. M., Jr.

1969-01-01

Monitoring device differentiates between malfunctions occurring in the system undergoing test and malfunctions within the test instrumentation itself. Electronic circuits in the monitor use transistors to commutate silicon controlled rectifiers by removing the drive voltage, display circuits are then used to monitor multiple discrete lines.

30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

TV Trouble-Shooting Manual. Volumes 9-10. Part 4: Chroma-Signal Reproduction Circuit. Student and Instructor's Manuals.

ERIC Educational Resources Information Center

Mukai, Masaaki; Kobayashi, Ryozo

These volumes are, respectively, the self-instructional student manual and the teacher manual that cover the fourth set of training topics in this course. Both contain identical information on the chroma signal reproduction circuit, including a block diagram of a chroma signal reproduction circuit and sections on the bandpass amplifier circuit,…

Swift Observatory Space Simulation Testing

NASA Technical Reports Server (NTRS)

Espiritu, Mellina; Choi, Michael K.; Scocik, Christopher S.

2004-01-01

The Swift Observatory is a Middle-Class Explorer (MIDEX) mission that is a rapidly re-pointing spacecraft with immediate data distribution capability to the astronomical community. Its primary objectives are to characterize and determine the origin of Gamma Ray Bursts (GRBs) and to use the collected data on GRB phenomena in order to probe the universe and gain insight into the physics of black hole formation and early universe. The main components of the spacecraft are the Burst Alert Telescope (BAT), Ultraviolet and Optical Telescope (UVOT), X-Ray Telescope (XRT), and Optical Bench (OB) instruments coupled with the Swift spacecraft (S/C) bus. The Swift Observatory will be tested at the Space Environment Simulation (SES) chamber at the Goddard Space Flight Center from May to June 2004 in order to characterize its thermal behavior in a vacuum environment. In order to simulate the independent thermal zones required by the BAT, XRT, UVOT, and OB instruments, the spacecraft is mounted on a chariot structure capable of maintaining adiabatic interfaces and enclosed in a modified, four section MSX fixture in order to accommodate the strategic placement of seven cryopanels (on four circuits), four heater panels, and a radiation source burst simulator mechanism. There are additionally 55 heater circuits on the spacecraft. To mitigate possible migration of silicone contaminants from BAT to the XRT and UVOT instruments, a contamination enclosure is to be fabricated around the BAT at the uppermost section of the MSX fixture. This paper discuses the test requirements and implemented thermal vacuum test configuration for the Swift Observatory.

Distributed coupling and multi-frequency microwave accelerators

DOEpatents

Tantawi, Sami G.; Li, Zenghai; Borchard, Philipp

2016-07-05

A microwave circuit for a linear accelerator has multiple metallic cell sections, a pair of distribution waveguide manifolds, and a sequence of feed arms connecting the manifolds to the cell sections. The distribution waveguide manifolds are connected to the cell sections so that alternating pairs of cell sections are connected to opposite distribution waveguide manifolds. The distribution waveguide manifolds have concave modifications of their walls opposite the feed arms, and the feed arms have portions of two distinct widths. In some embodiments, the distribution waveguide manifolds are connected to the cell sections by two different types of junctions adapted to allow two frequency operation. The microwave circuit may be manufactured by making two quasi-identical parts, and joining the two parts to form the microwave circuit, thereby allowing for many manufacturing techniques including electron beam welding, and thereby allowing the use of un-annealled copper alloys, and hence greater tolerance to high gradient operation.

[Computation of the cross-sectional area of the cable in the power circuit of the X-ray machine].

PubMed

Meng, Xin-min; Feng, Da-yu

2007-01-01

The source impedance of the power circuit in the x-ray machine is analyzed in the paper and based on the voltage drop generated by the impedance, the cross-sectional area of the cable is calculated. In the end, the cross-sectional areas of the cables, corresponding to their respective distances between the transformers and the switchboards are given.

Mammalian synthetic biology: emerging medical applications

PubMed Central

Kis, Zoltán; Pereira, Hugo Sant'Ana; Homma, Takayuki; Pedrigi, Ryan M.; Krams, Rob

2015-01-01

In this review, we discuss new emerging medical applications of the rapidly evolving field of mammalian synthetic biology. We start with simple mammalian synthetic biological components and move towards more complex and therapy-oriented gene circuits. A comprehensive list of ON–OFF switches, categorized into transcriptional, post-transcriptional, translational and post-translational, is presented in the first sections. Subsequently, Boolean logic gates, synthetic mammalian oscillators and toggle switches will be described. Several synthetic gene networks are further reviewed in the medical applications section, including cancer therapy gene circuits, immuno-regulatory networks, among others. The final sections focus on the applicability of synthetic gene networks to drug discovery, drug delivery, receptor-activating gene circuits and mammalian biomanufacturing processes. PMID:25808341

An Approach for Practical Use of Common-Mode Noise Reduction Technique for In-Vehicle Electronic Equipment

NASA Astrophysics Data System (ADS)

Uno, Takanori; Ichikawa, Kouji; Mabuchi, Yuichi; Nakamura, Atsushi; Okazaki, Yuji; Asai, Hideki

In this paper, we studied the use of common-mode noise reduction technique for in-vehicle electronic equipment in an actual instrument design. We have improved the circuit model of the common-mode noise that flows to the wire harness to add the effect of a bypass capacitor located near the LSI. We analyzed the improved circuit model using a circuit simulator and verified the effectiveness of the noise reduction condition derived from the circuit model. It was also confirmed that offsetting the impedance mismatch in the PCB section requires to make a circuit constant larger than that necessary for doing the impedance mismatch in the LSI section. An evaluation circuit board comprising an automotive microcomputer was prototyped to experiment on the common-mode noise reduction effect of the board. The experimental results showed the noise reduction effect of the board. The experimental results also revealed that the degree of impedance mismatch in the LSI section can be estimated by using a PCB having a known impedance. We further inquired into the optimization of impedance parameters, which is difficult for actual products at present. To satisfy the noise reduction condition composed of numerous parameters, we proposed a design method using an optimization algorithm and an electromagnetic field simulator, and confirmed its effectiveness.

30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2010 CFR

2010-07-01

... current circuits serving three-phase alternating current equipment and their auxiliary devices shall be... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and...

30 CFR 75.900-3 - Testing, examination, and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2011 CFR

2011-07-01

... current circuits serving three-phase alternating current equipment and their auxiliary devices shall be... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-3 Testing, examination, and...

Arc lamp power supply using a voltage multiplier

NASA Technical Reports Server (NTRS)

Leighty, Bradley D.

1988-01-01

A power supply is provided for an arc discharge lamp which includes a relatively low voltage high current power supply section and a high voltage starter circuit. The low voltage section includes a transformer, rectifier, variable resistor and a bank of capacitors, while the starter circuit comprises several diodes and capacitors connected as a Cockcroft-Walton multiplier. The starting circuit is effectively bypassed when the lamp arc is established and serves to automatically provide a high starting voltage to re-strike the lamp arc if the arc is extinguished by a power interruption.

Four-to-one power combiner for 20 GHz phased array antenna using RADC MMIC phase shifters

NASA Technical Reports Server (NTRS)

1991-01-01

The design and microwave simulation of two-to-one microstrip power combiners is described. The power combiners were designed for use in a four element phase array receive antenna subarray at 20 GHz. Four test circuits are described which were designed to enable testing of the power combiner and the four element phased array antenna. Test Circuit 1 enables measurement of the two-to-one power combiner. Test Circuit 2 enables measurement of the four-to-one power combiner. Test Circuit 3 enables measurement of a four element antenna array without phase shifting MMIC's in order to characterize the power combiner with the antenna patch-to-microstrip coaxial feedthroughs. Test circuit 4 is the four element phased array antenna including the RADC MMIC phase shifters and appropriate interconnects to provide bias voltages and control phase bits.

30 CFR 57.6403 - Branch circuits.

Code of Federal Regulations, 2010 CFR

2010-07-01

... SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Explosives Electric Blasting-Surface and Underground § 57.6403 Branch circuits. (a) If electric blasting includes the use of... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Branch circuits. 57.6403 Section 57.6403...

Adapting Aquatic Circuit Training for Special Populations.

ERIC Educational Resources Information Center

Thome, Kathleen

1980-01-01

The author discusses how land activities can be adapted to water so that individuals with handicapping conditions can participate in circuit training activities. An initial section lists such organizational procedures as providing vocal and/or visual cues for activities, having assistants accompany the performers throughout the circuit, and…

49 CFR 236.720 - Circuit, common return.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 49 Transportation 4 2010-10-01 2010-10-01 false Circuit, common return. 236.720 Section 236.720 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION... Circuit, common return. A term applied where one wire is used for the return of more than one electric...

21 CFR 868.5240 - Anesthesia breathing circuit.

Code of Federal Regulations, 2012 CFR

2012-04-01

... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Anesthesia breathing circuit. 868.5240 Section 868.5240 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5240 Anesthesia breathing circuit. (a...

21 CFR 868.5250 - Breathing circuit circulator.

Code of Federal Regulations, 2012 CFR

2012-04-01

... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Breathing circuit circulator. 868.5250 Section 868.5250 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5250 Breathing circuit circulator. (a...

21 CFR 868.5250 - Breathing circuit circulator.

Code of Federal Regulations, 2013 CFR

2013-04-01

... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Breathing circuit circulator. 868.5250 Section 868.5250 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5250 Breathing circuit circulator. (a...

21 CFR 868.5240 - Anesthesia breathing circuit.

Code of Federal Regulations, 2013 CFR

2013-04-01

... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Anesthesia breathing circuit. 868.5240 Section 868.5240 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES ANESTHESIOLOGY DEVICES Therapeutic Devices § 868.5240 Anesthesia breathing circuit. (a...

20 CFR 405.515 - Application of circuit court law.

Code of Federal Regulations, 2010 CFR

2010-04-01

... 20 Employees' Benefits 2 2010-04-01 2010-04-01 false Application of circuit court law. 405.515 Section 405.515 Employees' Benefits SOCIAL SECURITY ADMINISTRATION ADMINISTRATIVE REVIEW PROCESS FOR ADJUDICATING INITIAL DISABILITY CLAIMS Judicial Review § 405.515 Application of circuit court law. We will...

Test results for SEU and SEL immune memory circuits

NASA Technical Reports Server (NTRS)

Wiseman, D.; Canaris, J.; Whitaker, S.; Gambles, J.; Arave, K.; Arave, L.

1993-01-01

Test results for three SEU logic/circuit hardened CMOS memory circuits verify upset and latch-up immunity for two configurations to be in excess of 120 MeV cm(exp 2)/mg using a commercial, non-radiation hardened CMOS process. Test chips from three separate fabrication runs in two different process were evaluated.

42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 42 Public Health 1 2011-10-01 2011-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand flow...

42 CFR 84.94 - Gas flow test; closed-circuit apparatus.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 42 Public Health 1 2010-10-01 2010-10-01 false Gas flow test; closed-circuit apparatus. 84.94...-Contained Breathing Apparatus § 84.94 Gas flow test; closed-circuit apparatus. (a) Where oxygen is supplied... rated service time of the apparatus. (b) Where constant flow is used in conjunction with demand flow...

Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections

PubMed Central

Jeffery, A.; Elmquist, R. E.; Cage, M. E.

1995-01-01

Precision tests verify the dc equivalent circuit used by Ricketts and Kemeny to describe a quantum Hall effect device in terms of electrical circuit elements. The tests employ the use of cryogenic current comparators and the double-series and triple-series connection techniques of Delahaye. Verification of the dc equivalent circuit in double-series and triple-series connections is a necessary step in developing the ac quantum Hall effect as an intrinsic standard of resistance. PMID:29151768

30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

Code of Federal Regulations, 2011 CFR

2011-07-01

... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in a... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and...

30 CFR 75.900-4 - Testing, examination, and maintenance of circuit breakers; record.

Code of Federal Regulations, 2010 CFR

2010-07-01

... circuits serving three-phase alternating current equipment used in the mine. Such record shall be kept in a... Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900-4 Testing, examination, and...

Operation and Maintenance Manual, TECS 18.

DTIC Science & Technology

1978-11-01

width modulated variable output voltage and frequency using a three-phase transistor bridge circuit . Reduced power line electromagnetic interference...Description 3-1 Section II. Circuit Fundamentals 3-1 Section III. System Description 3-2 CHAPTER 4. Protection and Maintenance 4-1 Section I. Internal...Number I-la TECS 18 Electronic Module Location-Evaporator Side 1-3 1-lb TECS 18 Electronic Module Location-Condenser Side 1-4 1-2 Remote Control Panel 1-5

46 CFR 111.30-4 - Circuit breakers removable from the front.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 46 Shipping 4 2011-10-01 2011-10-01 false Circuit breakers removable from the front. 111.30-4 Section 111.30-4 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switchboards § 111.30-4 Circuit breakers removable from the front...

46 CFR 111.30-4 - Circuit breakers removable from the front.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 46 Shipping 4 2014-10-01 2014-10-01 false Circuit breakers removable from the front. 111.30-4 Section 111.30-4 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switchboards § 111.30-4 Circuit breakers removable from the front...

46 CFR 111.30-4 - Circuit breakers removable from the front.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 46 Shipping 4 2012-10-01 2012-10-01 false Circuit breakers removable from the front. 111.30-4 Section 111.30-4 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switchboards § 111.30-4 Circuit breakers removable from the front...

46 CFR 111.30-4 - Circuit breakers removable from the front.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 46 Shipping 4 2013-10-01 2013-10-01 false Circuit breakers removable from the front. 111.30-4 Section 111.30-4 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switchboards § 111.30-4 Circuit breakers removable from the front...

46 CFR 111.30-4 - Circuit breakers removable from the front.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 4 2010-10-01 2010-10-01 false Circuit breakers removable from the front. 111.30-4 Section 111.30-4 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Switchboards § 111.30-4 Circuit breakers removable from the front...

21 CFR 868.5260 - Breathing circuit bacterial filter.

Code of Federal Regulations, 2011 CFR

2011-04-01

... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Breathing circuit bacterial filter. 868.5260 Section 868.5260 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES... filter. (a) Identification. A breathing circuit bacterial filter is a device that is intended to remove...

21 CFR 868.5260 - Breathing circuit bacterial filter.

Code of Federal Regulations, 2010 CFR

2010-04-01

... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Breathing circuit bacterial filter. 868.5260 Section 868.5260 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES... filter. (a) Identification. A breathing circuit bacterial filter is a device that is intended to remove...

21 CFR 868.5260 - Breathing circuit bacterial filter.

Code of Federal Regulations, 2012 CFR

2012-04-01

... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Breathing circuit bacterial filter. 868.5260 Section 868.5260 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES... filter. (a) Identification. A breathing circuit bacterial filter is a device that is intended to remove...

21 CFR 868.5260 - Breathing circuit bacterial filter.

Code of Federal Regulations, 2014 CFR

2014-04-01

... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Breathing circuit bacterial filter. 868.5260 Section 868.5260 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES... filter. (a) Identification. A breathing circuit bacterial filter is a device that is intended to remove...

21 CFR 868.5260 - Breathing circuit bacterial filter.

Code of Federal Regulations, 2013 CFR

2013-04-01

... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Breathing circuit bacterial filter. 868.5260 Section 868.5260 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES... filter. (a) Identification. A breathing circuit bacterial filter is a device that is intended to remove...

46 CFR 111.60-9 - Segregation of vital circuits.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 4 2010-10-01 2010-10-01 false Segregation of vital circuits. 111.60-9 Section 111.60-9 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Wiring Materials and Methods § 111.60-9 Segregation of vital circuits. (a) General. A...

46 CFR 111.60-9 - Segregation of vital circuits.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 46 Shipping 4 2011-10-01 2011-10-01 false Segregation of vital circuits. 111.60-9 Section 111.60-9 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Wiring Materials and Methods § 111.60-9 Segregation of vital circuits. (a) General. A...

21 CFR 868.5250 - Breathing circuit circulator.

Code of Federal Regulations, 2010 CFR

2010-04-01

... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Breathing circuit circulator. 868.5250 Section 868.5250 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED... valves in an open position and reducing mechanical dead space and resistance in the breathing circuit. (b...

21 CFR 868.5250 - Breathing circuit circulator.

Code of Federal Regulations, 2011 CFR

2011-04-01

... 21 Food and Drugs 8 2011-04-01 2011-04-01 false Breathing circuit circulator. 868.5250 Section 868.5250 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED... valves in an open position and reducing mechanical dead space and resistance in the breathing circuit. (b...

CT Evaluation of Small-Diameter Coronary Artery Stents: Effect of an Integrated Circuit Detector with Iterative Reconstruction.

PubMed

Geyer, Lucas L; Glenn, G Russell; De Cecco, Carlo Nicola; Van Horn, Mark; Canstein, Christian; Silverman, Justin R; Krazinski, Aleksander W; Kemper, Jenny M; Bucher, Andreas; Ebersberger, Ullrich; Costello, Philip; Bamberg, Fabian; Schoepf, U Joseph

2015-09-01

To use suitable objective methods of analysis to assess the influence of the combination of an integrated-circuit computed tomographic (CT) detector and iterative reconstruction (IR) algorithms on the visualization of small (≤3-mm) coronary artery stents. By using a moving heart phantom, 18 data sets obtained from three coronary artery stents with small diameters were investigated. A second-generation dual-source CT system equipped with an integrated-circuit detector was used. Images were reconstructed with filtered back-projection (FBP) and IR at a section thickness of 0.75 mm (FBP75 and IR75, respectively) and IR at a section thickness of 0.50 mm (IR50). Multirow intensity profiles in Hounsfield units were modeled by using a sum-of-Gaussians fit to analyze in-plane image characteristics. Out-of-plane image characteristics were analyzed with z upslope of multicolumn intensity profiles in Hounsfield units. Statistical analysis was conducted with one-way analysis of variance and the Student t test. Independent of stent diameter and heart rate, IR75 resulted in significantly increased xy sharpness, signal-to-noise ratio, and contrast-to-noise ratio, as well as decreased blurring and noise compared with FBP75 (eg, 2.25-mm stent, 0 beats per minute; xy sharpness, 278.2 vs 252.3; signal-to-noise ratio, 46.6 vs 33.5; contrast-to-noise ratio, 26.0 vs 16.8; blurring, 1.4 vs 1.5; noise, 15.4 vs 21.2; all P < .001). In the z direction, the upslopes were substantially higher in the IR50 reconstructions (2.25-mm stent: IR50, 94.0; IR75, 53.1; and FBP75, 48.1; P < .001). The implementation of an integrated-circuit CT detector provides substantially sharper out-of-plane resolution of coronary artery stents at 0.5-mm section thickness, while the use of iterative image reconstruction mostly improves in-plane stent visualization.

42 CFR 84.95 - Service time test; open-circuit apparatus.

Code of Federal Regulations, 2013 CFR

2013-10-01

... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2013-10-01 2013-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

42 CFR 84.95 - Service time test; open-circuit apparatus.

Code of Federal Regulations, 2012 CFR

2012-10-01

... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2012-10-01 2012-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

42 CFR 84.95 - Service time test; open-circuit apparatus.

Code of Federal Regulations, 2014 CFR

2014-10-01

... classified according to the length of time it supplies air or oxygen to the breathing machine. (c) The... 42 Public Health 1 2014-10-01 2014-10-01 false Service time test; open-circuit apparatus. 84.95...-Contained Breathing Apparatus § 84.95 Service time test; open-circuit apparatus. (a) Service time will be...

Cable-fault locator

NASA Technical Reports Server (NTRS)

Cason, R. L.; Mcstay, J. J.; Heymann, A. P., Sr.

1979-01-01

Inexpensive system automatically indicates location of short-circuited section of power cable. Monitor does not require that cable be disconnected from its power source or that test signals be applied. Instead, ground-current sensors are installed in manholes or at other selected locations along cable run. When fault occurs, sensors transmit information about fault location to control center. Repair crew can be sent to location and cable can be returned to service with minimum of downtime.

A Sparsity-based Framework for Resolution Enhancement in Optical Fault Analysis of Integrated Circuits

DTIC Science & Technology

2015-01-01

for IC fault detection . This section provides background information on inversion methods. Conventional inversion techniques and their shortcomings are...physical techniques, electron beam imaging/analysis, ion beam techniques, scanning probe techniques. Electrical tests are used to detect faults in 13 an...hand, there is also the second harmonic technique through which duty cycle degradation faults are detected by collecting the magnitude and the phase of

Solid state remote circuit selector switch

NASA Technical Reports Server (NTRS)

Peterson, V. S.

1970-01-01

Remote switching circuit utilizes voltage logic to switch on desired circuit. Circuit controls rotating multi-range pressure transducers in jet engine testing and can be used in coded remote circuit activator where sequence of switching has to occur in defined length of time to prevent false or undesired circuit activation.

Retractable pin dual in-line package test clip

DOEpatents

Bandzuch, Gregory S.; Kosslow, William J.

1996-01-01

This invention is a Dual In-Line Package (DIP) test clip for use when troubleshooting circuits containing DIP integrated circuits. This test clip is a significant improvement over existing DIP test clips in that it has retractable pins which will permit troubleshooting without risk of accidentally shorting adjacent pins together when moving probes to different pins on energized circuits or when the probe is accidentally bumped while taking measurements.

ac Modeling and impedance spectrum tests of the superconducting magnetic field coils for the Wendelstein 7-X fusion experiment.

PubMed

Ehmler, Hartmut; Köppen, Matthias

2007-10-01

The impedance spectrum test was employed for detection of short circuits within Wendelstein 7-X (W7-X) superconducting magnetic field coils. This test is based on measuring the complex impedance over several decades of frequency. The results are compared to predictions of appropriate electrical equivalent circuits of coils in different production states or during cold test. When the equivalent circuit is not too complicated the impedance can be represented by an analytic function. A more detailed analysis is performed with a network simulation code. The overall agreement of measured and calculated or simulated spectra is good. Two types of short circuits which appeared are presented and analyzed. The detection limit of the method is discussed. It is concluded that combined high-voltage ac and low-voltage impedance spectrum tests are ideal means to rule out short circuits in the W7-X coils.

Gas turbine combustor transition

DOEpatents

Coslow, Billy Joe; Whidden, Graydon Lane

1999-01-01

A method of converting a steam cooled transition to an air cooled transition in a gas turbine having a compressor in fluid communication with a combustor, a turbine section in fluid communication with the combustor, the transition disposed in a combustor shell and having a cooling circuit connecting a steam outlet and a steam inlet and wherein hot gas flows from the combustor through the transition and to the turbine section, includes forming an air outlet in the transition in fluid communication with the cooling circuit and providing for an air inlet in the transition in fluid communication with the cooling circuit.

Gas turbine combustor transition

DOEpatents

Coslow, B.J.; Whidden, G.L.

1999-05-25

A method is described for converting a steam cooled transition to an air cooled transition in a gas turbine having a compressor in fluid communication with a combustor, a turbine section in fluid communication with the combustor, the transition disposed in a combustor shell and having a cooling circuit connecting a steam outlet and a steam inlet and wherein hot gas flows from the combustor through the transition and to the turbine section, includes forming an air outlet in the transition in fluid communication with the cooling circuit and providing for an air inlet in the transition in fluid communication with the cooling circuit. 7 figs.

30 CFR 77.902-1 - Fail safe ground check circuits; maximum voltage.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Fail safe ground check circuits; maximum voltage. 77.902-1 Section 77.902-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.902-1 Fail safe...

30 CFR 77.902-1 - Fail safe ground check circuits; maximum voltage.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Fail safe ground check circuits; maximum voltage. 77.902-1 Section 77.902-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.902-1 Fail safe...

30 CFR 77.902-1 - Fail safe ground check circuits; maximum voltage.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Fail safe ground check circuits; maximum voltage. 77.902-1 Section 77.902-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.902-1 Fail safe...

21 CFR 886.5820 - Closed-circuit television reading system.

Code of Federal Regulations, 2014 CFR

2014-04-01

... 21 Food and Drugs 8 2014-04-01 2014-04-01 false Closed-circuit television reading system. 886.5820 Section 886.5820 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES OPHTHALMIC DEVICES Therapeutic Devices § 886.5820 Closed-circuit television reading system. (a) Identification. A...

21 CFR 886.5820 - Closed-circuit television reading system.

Code of Federal Regulations, 2012 CFR

2012-04-01

... 21 Food and Drugs 8 2012-04-01 2012-04-01 false Closed-circuit television reading system. 886.5820 Section 886.5820 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES OPHTHALMIC DEVICES Therapeutic Devices § 886.5820 Closed-circuit television reading system. (a) Identification. A...

21 CFR 886.5820 - Closed-circuit television reading system.

Code of Federal Regulations, 2013 CFR

2013-04-01

... 21 Food and Drugs 8 2013-04-01 2013-04-01 false Closed-circuit television reading system. 886.5820 Section 886.5820 Food and Drugs FOOD AND DRUG ADMINISTRATION, DEPARTMENT OF HEALTH AND HUMAN SERVICES (CONTINUED) MEDICAL DEVICES OPHTHALMIC DEVICES Therapeutic Devices § 886.5820 Closed-circuit television reading system. (a) Identification. A...

30 CFR 75.519-1 - Main power circuits; disconnecting switches; locations.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Main power circuits; disconnecting switches...-General § 75.519-1 Main power circuits; disconnecting switches; locations. Section 75.519 requires (a) that a disconnecting switch be installed on the surface at a point within 500 feet of the place where...

30 CFR 75.519-1 - Main power circuits; disconnecting switches; locations.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Main power circuits; disconnecting switches...-General § 75.519-1 Main power circuits; disconnecting switches; locations. Section 75.519 requires (a) that a disconnecting switch be installed on the surface at a point within 500 feet of the place where...

30 CFR 75.519-1 - Main power circuits; disconnecting switches; locations.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Main power circuits; disconnecting switches...-General § 75.519-1 Main power circuits; disconnecting switches; locations. Section 75.519 requires (a) that a disconnecting switch be installed on the surface at a point within 500 feet of the place where...

30 CFR 75.519-1 - Main power circuits; disconnecting switches; locations.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Main power circuits; disconnecting switches...-General § 75.519-1 Main power circuits; disconnecting switches; locations. Section 75.519 requires (a) that a disconnecting switch be installed on the surface at a point within 500 feet of the place where...

30 CFR 75.519-1 - Main power circuits; disconnecting switches; locations.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Main power circuits; disconnecting switches...-General § 75.519-1 Main power circuits; disconnecting switches; locations. Section 75.519 requires (a) that a disconnecting switch be installed on the surface at a point within 500 feet of the place where...

49 CFR 236.311 - Signal control circuits, selection through track relays or devices functioning as track relays...

Code of Federal Regulations, 2010 CFR

2010-10-01

... automatic interlocking. (a) The control circuits for aspects with indications more favorable than “proceed... 49 Transportation 4 2010-10-01 2010-10-01 false Signal control circuits, selection through track... automatic interlocking. 236.311 Section 236.311 Transportation Other Regulations Relating to Transportation...

30 CFR 57.12001 - Circuit overload protection.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

30 CFR 57.12001 - Circuit overload protection.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

30 CFR 57.12001 - Circuit overload protection.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

30 CFR 57.12001 - Circuit overload protection.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

30 CFR 57.12001 - Circuit overload protection.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

46 CFR 169.672 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 7 2010-10-01 2010-10-01 false Wiring for power and lighting circuits. 169.672 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of Less Than 50 Volts on Vessels of Less Than 100 Gross Tons § 169.672 Wiring for power and lighting circuits. (a...

46 CFR 169.679 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 46 Shipping 7 2010-10-01 2010-10-01 false Wiring for power and lighting circuits. 169.679 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of 50 Volts Or More on Vessels of Less Than 100 Gross Tons § 169.679 Wiring for power and lighting circuits. Wiring...

30 CFR 57.6404 - Separation of blasting circuits from power source.

Code of Federal Regulations, 2010 CFR

2010-07-01

... source. 57.6404 Section 57.6404 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF... circuits from power source. (a) Switches used to connect the power source to a blasting circuit shall be locked in the open position except when closed to fire the blast. (b) Lead wires shall not be connected...

46 CFR 169.679 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 46 Shipping 7 2014-10-01 2014-10-01 false Wiring for power and lighting circuits. 169.679 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of 50 Volts Or More on Vessels of Less Than 100 Gross Tons § 169.679 Wiring for power and lighting circuits. Wiring...

46 CFR 169.679 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2011 CFR

2011-10-01

... 46 Shipping 7 2011-10-01 2011-10-01 false Wiring for power and lighting circuits. 169.679 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of 50 Volts Or More on Vessels of Less Than 100 Gross Tons § 169.679 Wiring for power and lighting circuits. Wiring...

46 CFR 169.679 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 46 Shipping 7 2012-10-01 2012-10-01 false Wiring for power and lighting circuits. 169.679 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of 50 Volts Or More on Vessels of Less Than 100 Gross Tons § 169.679 Wiring for power and lighting circuits. Wiring...

46 CFR 169.679 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 46 Shipping 7 2013-10-01 2013-10-01 false Wiring for power and lighting circuits. 169.679 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of 50 Volts Or More on Vessels of Less Than 100 Gross Tons § 169.679 Wiring for power and lighting circuits. Wiring...

46 CFR 169.672 - Wiring for power and lighting circuits.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 46 Shipping 7 2012-10-01 2012-10-01 false Wiring for power and lighting circuits. 169.672 Section... SCHOOL VESSELS Machinery and Electrical Electrical Installations Operating at Potentials of Less Than 50 Volts on Vessels of Less Than 100 Gross Tons § 169.672 Wiring for power and lighting circuits. (a...

75 FR 24742 - In the Matter of Certain Large Scale Integrated Circuit Semiconductor Chips and Products...

Federal Register 2010, 2011, 2012, 2013, 2014

2010-05-05

... Integrated Circuit Semiconductor Chips and Products Containing Same; Notice of Investigation AGENCY: U.S... of certain large scale integrated circuit semiconductor chips and products containing same by reason... alleges that an industry in the United States exists as required by subsection (a)(2) of section 337. The...

Accurate time delay technology in simulated test for high precision laser range finder

NASA Astrophysics Data System (ADS)

Chen, Zhibin; Xiao, Wenjian; Wang, Weiming; Xue, Mingxi

2015-10-01

With the continuous development of technology, the ranging accuracy of pulsed laser range finder (LRF) is higher and higher, so the maintenance demand of LRF is also rising. According to the dominant ideology of "time analog spatial distance" in simulated test for pulsed range finder, the key of distance simulation precision lies in the adjustable time delay. By analyzing and comparing the advantages and disadvantages of fiber and circuit delay, a method was proposed to improve the accuracy of the circuit delay without increasing the count frequency of the circuit. A high precision controllable delay circuit was designed by combining the internal delay circuit and external delay circuit which could compensate the delay error in real time. And then the circuit delay accuracy could be increased. The accuracy of the novel circuit delay methods proposed in this paper was actually measured by a high sampling rate oscilloscope actual measurement. The measurement result shows that the accuracy of the distance simulated by the circuit delay is increased from +/- 0.75m up to +/- 0.15m. The accuracy of the simulated distance is greatly improved in simulated test for high precision pulsed range finder.

30 CFR 75.824 - Electrical protection.

Code of Federal Regulations, 2010 CFR

2010-07-01

... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

30 CFR 75.824 - Electrical protection.

Code of Federal Regulations, 2012 CFR

2012-07-01

... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

30 CFR 75.824 - Electrical protection.

Code of Federal Regulations, 2014 CFR

2014-07-01

... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

30 CFR 75.824 - Electrical protection.

Code of Federal Regulations, 2011 CFR

2011-07-01

... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

30 CFR 75.824 - Electrical protection.

Code of Federal Regulations, 2013 CFR

2013-07-01

... transformer and over-current relay in the neutral grounding resistor circuit. (vi) A single window-type current transformer that encircles all three-phase conductors must be used to activate the ground-fault... current transformer. (vii) A test circuit for the ground-fault device must be provided. The test circuit...

Steam cycle of the FR2 (in German)

DOE Office of Scientific and Technical Information (OSTI.GOV)

Perinic, D.; Schmidt, T.

1973-01-01

Following a brief explanation of the requirement of the experimental circuit, the use of irradiation and the circuit are described in detail. The installed experimental equipment within the test circuit is described and the safety problems discussed. The operation of the test equipment is summarized. (GE)

Mammalian synthetic biology: emerging medical applications.

PubMed

Kis, Zoltán; Pereira, Hugo Sant'Ana; Homma, Takayuki; Pedrigi, Ryan M; Krams, Rob

2015-05-06

In this review, we discuss new emerging medical applications of the rapidly evolving field of mammalian synthetic biology. We start with simple mammalian synthetic biological components and move towards more complex and therapy-oriented gene circuits. A comprehensive list of ON-OFF switches, categorized into transcriptional, post-transcriptional, translational and post-translational, is presented in the first sections. Subsequently, Boolean logic gates, synthetic mammalian oscillators and toggle switches will be described. Several synthetic gene networks are further reviewed in the medical applications section, including cancer therapy gene circuits, immuno-regulatory networks, among others. The final sections focus on the applicability of synthetic gene networks to drug discovery, drug delivery, receptor-activating gene circuits and mammalian biomanufacturing processes. © 2015 The Author(s) Published by the Royal Society. All rights reserved.

Gas turbine cooling system

DOEpatents

Bancalari, Eduardo E.

2001-01-01

A gas turbine engine (10) having a closed-loop cooling circuit (39) for transferring heat from the hot turbine section (16) to the compressed air (24) produced by the compressor section (12). The closed-loop cooling system (39) includes a heat exchanger (40) disposed in the flow path of the compressed air (24) between the outlet of the compressor section (12) and the inlet of the combustor (14). A cooling fluid (50) may be driven by a pump (52) located outside of the engine casing (53) or a pump (54) mounted on the rotor shaft (17). The cooling circuit (39) may include an orifice (60) for causing the cooling fluid (50) to change from a liquid state to a gaseous state, thereby increasing the heat transfer capacity of the cooling circuit (39).

Elements configuration of the open lead test circuit

DOE Office of Scientific and Technical Information (OSTI.GOV)

Fukuzaki, Yumi, E-mail: 14514@sr.kagawa-nct.ac.jp; Ono, Akira

In the field of electronics, small electronic devices are widely utilized because they are easy to carry. The devices have various functions by user’s request. Therefore, the lead’s pitch or the ball’s pitch have been narrowed and high-density printed circuit board has been used in the devices. Use of the ICs which have narrow lead pitch makes normal connection difficult. When logic circuits in the devices are fabricated with the state-of-the-art technology, some faults have occurred more frequently. It can be divided into types of open faults and short faults. We have proposed a new test method using a testmore » circuit in the past. This paper propose elements configuration of the test circuit.« less

Circuit reliability boosted by soldering pins of disconnect plugs to sockets

NASA Technical Reports Server (NTRS)

Pierce, W. B.

1964-01-01

Where disconnect pins must be used for wiring and testing a circuit, improved system reliability is obtained by making a permanent joint between pins and sockets of the disconnect plug. After the circuit has been tested, contact points may be fused through soldering, brazing, or welding.

Computational Analysis of the Transonic Dynamics Tunnel Using FUN3D

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chwalowski, Pawel; Quon, Eliot; Brynildsen, Scott E.

This paper presents results from an explanatory two-year effort of applying Computational Fluid Dynamics (CFD) to analyze the empty-tunnel flow in the NASA Langley Research Center Transonic Dynamics Tunnel (TDT). The TDT is a continuous-flow, closed circuit, 16- x 16-foot slotted-test-section wind tunnel, with capabilities to use air or heavy gas as a working fluid. In this study, experimental data acquired in the empty tunnel using the R-134a test medium was used to calibrate the computational data. The experimental calibration data includes wall pressures, boundary-layer profiles, and the tunnel centerline Mach number profiles. Subsonic and supersonic flow regimes were considered,more » focusing on Mach 0.5, 0.7 and Mach 1.1 in the TDT test section. This study discusses the computational domain, boundary conditions, and initial conditions selected in the resulting steady-state analyses using NASA's FUN3D CFD software.« less

Computational Analysis of the Transonic Dynamics Tunnel Using FUN3D

NASA Technical Reports Server (NTRS)

Chwalowski, Pawel; Quon, Eliot; Brynildsen, Scott E.

2016-01-01

This paper presents results from an exploratory two-year effort of applying Computational Fluid Dynamics (CFD) to analyze the empty-tunnel flow in the NASA Langley Research Center Transonic Dynamics Tunnel (TDT). The TDT is a continuous-flow, closed circuit, 16- x 16-foot slotted-test-section wind tunnel, with capabilities to use air or heavy gas as a working fluid. In this study, experimental data acquired in the empty tunnel using the R-134a test medium was used to calibrate the computational data. The experimental calibration data includes wall pressures, boundary-layer profiles, and the tunnel centerline Mach number profiles. Subsonic and supersonic flow regimes were considered, focusing on Mach 0.5, 0.7 and Mach 1.1 in the TDT test section. This study discusses the computational domain, boundary conditions, and initial conditions selected and the resulting steady-state analyses using NASA's FUN3D CFD software.

Automatic circuit interrupter

NASA Technical Reports Server (NTRS)

Dwinell, W. S.

1979-01-01

In technique, voice circuits connecting crew's cabin to launch station through umbilical connector disconnect automatically unused, or deadened portion of circuits immediately after vehicle is launched, eliminating possibility that unused wiring interferes with voice communications inside vehicle or need for manual cutoff switch and its associated wiring. Technique is applied to other types of electrical actuation circuits, also launch of mapped vehicles, such as balloons, submarines, test sleds, and test chambers-all requiring assistance of ground crew.

46 CFR 111.70-1 - General.

Code of Federal Regulations, 2010 CFR

2010-10-01

... Motor Circuits, Controllers, and Protection § 111.70-1 General. (a) Each motor circuit, controller, and protection must meet the requirements of ABS Steel Vessel Rules, sections 4-8-2/9.17, 4-8-3/5.7.3, 4-8-4/9.5...: (1) Each steering gear motor circuit and protection must meet part 58, subpart 58.25, of this chapter...

46 CFR 111.70-1 - General.

Code of Federal Regulations, 2011 CFR

2011-10-01

... Motor Circuits, Controllers, and Protection § 111.70-1 General. (a) Each motor circuit, controller, and protection must meet the requirements of ABS Steel Vessel Rules, sections 4-8-2/9.17, 4-8-3/5.7.3, 4-8-4/9.5...: (1) Each steering gear motor circuit and protection must meet part 58, subpart 58.25, of this chapter...

46 CFR 120.340 - Cable and wiring requirements.

Code of Federal Regulations, 2011 CFR

2011-10-01

... for the circuit in which they are used; (2) Be installed in a manner to avoid or reduce interference... paragraph (b)(8) of this section. (c) Conductors in power and lighting circuits must be No. 14 American Wire Gauge (AWG) or larger. Conductors in control and indicator circuits must be No. 22 AWG or larger. (d...

46 CFR 120.340 - Cable and wiring requirements.

Code of Federal Regulations, 2013 CFR

2013-10-01

... for the circuit in which they are used; (2) Be installed in a manner to avoid or reduce interference... paragraph (b)(8) of this section. (c) Conductors in power and lighting circuits must be No. 14 American Wire Gauge (AWG) or larger. Conductors in control and indicator circuits must be No. 22 AWG or larger. (d...

46 CFR 120.340 - Cable and wiring requirements.

Code of Federal Regulations, 2014 CFR

2014-10-01

... for the circuit in which they are used; (2) Be installed in a manner to avoid or reduce interference... paragraph (b)(8) of this section. (c) Conductors in power and lighting circuits must be No. 14 American Wire Gauge (AWG) or larger. Conductors in control and indicator circuits must be No. 22 AWG or larger. (d...

46 CFR 120.340 - Cable and wiring requirements.

Code of Federal Regulations, 2012 CFR

2012-10-01

... for the circuit in which they are used; (2) Be installed in a manner to avoid or reduce interference... paragraph (b)(8) of this section. (c) Conductors in power and lighting circuits must be No. 14 American Wire Gauge (AWG) or larger. Conductors in control and indicator circuits must be No. 22 AWG or larger. (d...

Preheater in the 10-by 10-Foot Supersonic Wind Tunnel

NASA Image and Video Library

1958-04-21

The 10- by 10-Foot Supersonic Wind Tunnel at the NACA Lewis Flight Propulsion Laboratory was built under the Congressional Unitary Plan Act which coordinated wind tunnel construction at the NACA, Air Force, industry, and universities. The 10- by 10, which began operation in 1956, was the largest of the three NACA tunnels built under the act. Researchers could test engines up to five feet in diameter in the 10- by 10-foot test section. A 250,000-horsepower axial-flow compressor fan can generate airflows up to Mach 3.5 through the test section. The incoming air must be dehumidified and cooled so that the proper conditions are present for the test. A large air dryer with 1,890 tons of activated alumina soaks up 1.5 tons of water per minute from the airflow. A cooling apparatus equivalent to 250,000 household air conditioners is used to cool the air. The air heater is located just upstream from the test section. Natural gas is combusted in the tunnel to increase the air temperature. The system could only be employed when the tunnel was run in its closed-circuit propulsion mode.

The NASA Langley 16-Foot Transonic Tunnel: Historical Overview, Facility Description, Calibration, Flow Characteristics, and Test Capabilities

NASA Technical Reports Server (NTRS)

Capone, Francis J.; Bangert, Linda S.; Asbury, Scott C.; Mills, Charles T. L.; Bare, E. Ann

1995-01-01

The Langley 16-Foot Transonic Tunnel is a closed-circuit single-return atmospheric wind tunnel that has a slotted octagonal test section with continuous air exchange. The wind tunnel speed can be varied continuously over a Mach number range from 0.1 to 1.3. Test-section plenum suction is used for speeds above a Mach number of 1.05. Over a period of some 40 years, the wind tunnel has undergone many modifications. During the modifications completed in 1990, a new model support system that increased blockage, new fan blades, a catcher screen for the first set of turning vanes, and process controllers for tunnel speed, model attitude, and jet flow for powered models were installed. This report presents a complete description of the Langley 16-Foot Transonic Tunnel and auxiliary equipment, the calibration procedures, and the results of the 1977 and the 1990 wind tunnel calibration with test section air removal. Comparisons with previous calibrations showed that the modifications made to the wind tunnel had little or no effect on the aerodynamic characteristics of the tunnel. Information required for planning experimental investigations and the use of test hardware and model support systems is also provided.

Advanced Space Suit PLSS 2.0 Cooling Loop Evaluation and PLSS 2.5 Recommendations

NASA Technical Reports Server (NTRS)

Steele, John; Quinn, Greg; Campbell, Colin; Makinen, Janice; Watts, Carly; Westheimer, Dave

2016-01-01

From 2012 to 2015 The NASA/JSC AdvSS (Advanced Space Suit) PLSS (Primary Life Support Subsystem) team, with support from UTC Aerospace Systems, performed the build-up, packaging and testing of PLSS 2.0. A key aspect of that testing was the evaluation of the long-term health of the water cooling circuit and the interfacing components. Intermittent and end-of-test water, residue and hardware analyses provided valuable information on the status of the water cooling circuit, and the approaches that would be necessary to enhance water cooling circuit health in the future. The evaluated data has been consolidated, interpreted and woven into an action plan for the maintenance of water cooling circuit health for the planned FY (fiscal year) 2016 through FY 2018 PLSS 2.5 testing. This paper provides an overview of the PLSS 2.0 water cooling circuit findings and the associated steps to be taken in that regard for the PLSS 2.5 testing.

Microwave integrated circuit for Josephson voltage standards

NASA Technical Reports Server (NTRS)

Holdeman, L. B.; Toots, J.; Chang, C. C. (Inventor)

1980-01-01

A microwave integrated circuit comprised of one or more Josephson junctions and short sections of microstrip or stripline transmission line is fabricated from thin layers of superconducting metal on a dielectric substrate. The short sections of transmission are combined to form the elements of the circuit and particularly, two microwave resonators. The Josephson junctions are located between the resonators and the impedance of the Josephson junctions forms part of the circuitry that couples the two resonators. The microwave integrated circuit has an application in Josephson voltage standards. In this application, the device is asymmetrically driven at a selected frequency (approximately equal to the resonance frequency of the resonators), and a d.c. bias is applied to the junction. By observing the current voltage characteristic of the junction, a precise voltage, proportional to the frequency of the microwave drive signal, is obtained.

Focal plane infrared readout circuit with automatic background suppression

NASA Technical Reports Server (NTRS)

Pain, Bedabrata (Inventor); Yang, Guang (Inventor); Sun, Chao (Inventor); Shaw, Timothy J. (Inventor); Wrigley, Chris J. (Inventor)

2002-01-01

A circuit for reading out a signal from an infrared detector includes a current-mode background-signal subtracting circuit having a current memory which can be enabled to sample and store a dark level signal from the infrared detector during a calibration phase. The signal stored by the current memory is subtracted from a signal received from the infrared detector during an imaging phase. The circuit also includes a buffered direct injection input circuit and a differential voltage readout section. By performing most of the background signal estimation and subtraction in a current mode, a low gain can be provided by the buffered direct injection input circuit to keep the gain of the background signal relatively small, while a higher gain is provided by the differential voltage readout circuit. An array of such readout circuits can be used in an imager having an array of infrared detectors. The readout circuits can provide a high effective handling capacity.

Calculating Second-Order Effects in MOSFET's

NASA Technical Reports Server (NTRS)

Benumof, Reuben; Zoutendyk, John A.; Coss, James R.

1990-01-01

Collection of mathematical models includes second-order effects in n-channel, enhancement-mode, metal-oxide-semiconductor field-effect transistors (MOSFET's). When dimensions of circuit elements relatively large, effects neglected safely. However, as very-large-scale integration of microelectronic circuits leads to MOSFET's shorter or narrower than 2 micrometer, effects become significant in design and operation. Such computer programs as widely-used "Simulation Program With Integrated Circuit Emphasis, Version 2" (SPICE 2) include many of these effects. In second-order models of n-channel, enhancement-mode MOSFET, first-order gate-depletion region diminished by triangular-cross-section deletions on end and augmented by circular-wedge-cross-section bulges on sides.

Fault tolerant system based on IDDQ testing

NASA Astrophysics Data System (ADS)

Guibane, Badi; Hamdi, Belgacem; Mtibaa, Abdellatif; Bensalem, Brahim

2018-06-01

Offline test is essential to ensure good manufacturing quality. However, for permanent or transient faults that occur during the use of the integrated circuit in an application, an online integrated test is needed as well. This procedure should ensure the detection and possibly the correction or the masking of these faults. This requirement of self-correction is sometimes necessary, especially in critical applications that require high security such as automotive, space or biomedical applications. We propose a fault-tolerant design for analogue and mixed-signal design complementary metal oxide (CMOS) circuits based on the quiescent current supply (IDDQ) testing. A defect can cause an increase in current consumption. IDDQ testing technique is based on the measurement of power supply current to distinguish between functional and failed circuits. The technique has been an effective testing method for detecting physical defects such as gate-oxide shorts, floating gates (open) and bridging defects in CMOS integrated circuits. An architecture called BICS (Built In Current Sensor) is used for monitoring the supply current (IDDQ) of the connected integrated circuit. If the measured current is not within the normal range, a defect is signalled and the system switches connection from the defective to a functional integrated circuit. The fault-tolerant technique is composed essentially by a double mirror built-in current sensor, allowing the detection of abnormal current consumption and blocks allowing the connection to redundant circuits, if a defect occurs. Spices simulations are performed to valid the proposed design.

Digital circuits for computer applications: A compilation

NASA Technical Reports Server (NTRS)

1972-01-01

The innovations in this updated series of compilations dealing with electronic technology represent a carefully selected collection of digital circuits which have direct application in computer oriented systems. In general, the circuits have been selected as representative items of each section and have been included on their merits of having universal applications in digital computers and digital data processing systems. As such, they should have wide appeal to the professional engineer and scientist who encounter the fundamentals of digital techniques in their daily activities. The circuits are grouped as digital logic circuits, analog to digital converters, and counters and shift registers.

EHW Approach to Temperature Compensation of Electronics

NASA Technical Reports Server (NTRS)

Stoica, Adrian

2004-01-01

Efforts are under way to apply the concept of evolvable hardware (EHW) to compensate for variations, with temperature, in the operational characteristics of electronic circuits. To maintain the required functionality of a given circuit at a temperature above or below the nominal operating temperature for which the circuit was originally designed, a new circuit would be evolved; moreover, to obtain the required functionality over a very wide temperature range, there would be evolved a number of circuits, each of which would satisfy the performance requirements over a small part of the total temperature range. The basic concepts and some specific implementations of EHW were described in a number of previous NASA Tech Briefs articles, namely, "Reconfigurable Arrays of Transistors for Evolvable Hardware" (NPO-20078), Vol. 25, No. 2 (February 2001), page 36; Evolutionary Automated Synthesis of Electronic Circuits (NPO- 20535), Vol. 26, No. 7 (July 2002), page 37; "Designing Reconfigurable Antennas Through Hardware Evolution" (NPO-20666), Vol. 26, No. 7 (July 2002), page 38; "Morphing in Evolutionary Synthesis of Electronic Circuits" (NPO-20837), Vol. 26, No. 8 (August 2002), page 31; "Mixtrinsic Evolutionary Synthesis of Electronic Circuits" (NPO-20773) Vol. 26, No. 8 (August 2002), page 32; and "Synthesis of Fuzzy-Logic Circuits in Evolvable Hardware" (NPO-21095) Vol. 26, No. 11 (November 2002), page 38. To recapitulate from the cited prior articles: EHW is characterized as evolutionary in a quasi-genetic sense. The essence of EHW is to construct and test a sequence of populations of circuits that function as incrementally better solutions of a given design problem through the selective, repetitive connection and/or disconnection of capacitors, transistors, amplifiers, inverters, and/or other circuit building blocks. The connection and disconnection can be effected by use of field-programmable transistor arrays (FPTAs). The evolution is guided by a search-andoptimization algorithm (in particular, a genetic algorithm) that operates in the space of possible circuits to find a circuit that exhibits an acceptably close approximation of the desired functionality. The evolved circuits can be tested by mathematical modeling (that is, computational simulation) only, tested in real hardware, or tested in combinations of computational simulation and real hardware.

The Effects of Pressure on Gases in Solution: Possible Insights to Improve Microbubble Filtration for Extracorporeal Circulation

PubMed Central

Herbst, Daniel P.

2013-01-01

Abstract: Improvements in micropore arterial line filter designs used for extracorporeal circulation are still needed because microbubbles larger than the rated pore sizes are being detected beyond the filter outlet. Linked to principles governing the function of micropore filters, fluid pressures contained in extracorporeal circuits also influence the behavior of gas bubbles and the extent to which they are carried in a fluid flow. To better understand the relationship between pressure and microbubble behavior, two ex vivo test circuits with and without inline resistance were designed to assess changes in microbubble load with changes in pressure. Ultrasound Doppler probes were used to measure and compare the quality and quantity of microbubbles generated in each test circuit. Analysis of microbubble load was separated into two distinct phases, the time periods during and immediately after bubble generation. Although microbubble number decreased similarly in both test circuits, changes in microbubble volume were significant only in the test circuit with inline resistance. The test circuit with inline resistance also showed a decrease in the rate of volume transferred across each ultrasound Doppler probe and the microbubble number and size range measured in the postbubble generation period. The present research proposes that fluid pressures contained in extracorporeal circuits may be used to affect gases in solution as a possible method to improve microbubble filtration during extracorporeal circulation. PMID:23930378

The effects of pressure on gases in solution: possible insights to improve microbubble filtration for extracorporeal circulation.

PubMed

Herbst, Daniel P

2013-06-01

Improvements in micropore arterial line filter designs used for extracorporeal circulation are still needed because microbubbles larger than the rated pore sizes are being detected beyond the filter outlet. Linked to principles governing the function of micropore filters, fluid pressures contained in extracorporeal circuits also influence the behavior of gas bubbles and the extent to which they are carried in a fluid flow. To better understand the relationship between pressure and microbubble behavior, two ex vivo test circuits with and without inline resistance were designed to assess changes in microbubble load with changes in pressure. Ultrasound Doppler probes were used to measure and compare the quality and quantity of microbubbles generated in each test circuit. Analysis of microbubble load was separated into two distinct phases, the time periods during and immediately after bubble generation. Although microbubble number decreased similarly in both test circuits, changes in microbubble volume were significant only in the test circuit with inline resistance. The test circuit with inline resistance also showed a decrease in the rate of volume transferred across each ultrasound Doppler probe and the microbubble number and size range measured in the postbubble generation period. The present research proposes that fluid pressures contained in extracorporeal circuits may be used to affect gases in solution as a possible method to improve microbubble filtration during extracorporeal circulation.

Re-using biological devices: a model-aided analysis of interconnected transcriptional cascades designed from the bottom-up.

PubMed

Pasotti, Lorenzo; Bellato, Massimo; Casanova, Michela; Zucca, Susanna; Cusella De Angelis, Maria Gabriella; Magni, Paolo

2017-01-01

The study of simplified, ad-hoc constructed model systems can help to elucidate if quantitatively characterized biological parts can be effectively re-used in composite circuits to yield predictable functions. Synthetic systems designed from the bottom-up can enable the building of complex interconnected devices via rational approach, supported by mathematical modelling. However, such process is affected by different, usually non-modelled, unpredictability sources, like cell burden. Here, we analyzed a set of synthetic transcriptional cascades in Escherichia coli . We aimed to test the predictive power of a simple Hill function activation/repression model (no-burden model, NBM) and of a recently proposed model, including Hill functions and the modulation of proteins expression by cell load (burden model, BM). To test the bottom-up approach, the circuit collection was divided into training and test sets, used to learn individual component functions and test the predicted output of interconnected circuits, respectively. Among the constructed configurations, two test set circuits showed unexpected logic behaviour. Both NBM and BM were able to predict the quantitative output of interconnected devices with expected behaviour, but only the BM was also able to predict the output of one circuit with unexpected behaviour. Moreover, considering training and test set data together, the BM captures circuits output with higher accuracy than the NBM, which is unable to capture the experimental output exhibited by some of the circuits even qualitatively. Finally, resource usage parameters, estimated via BM, guided the successful construction of new corrected variants of the two circuits showing unexpected behaviour. Superior descriptive and predictive capabilities were achieved considering resource limitation modelling, but further efforts are needed to improve the accuracy of models for biological engineering.

Cell short circuit, preshort signature

NASA Technical Reports Server (NTRS)

Lurie, C.

1980-01-01

Short-circuit events observed in ground test simulations of DSCS-3 battery in-orbit operations are analyzed. Voltage signatures appearing in the data preceding the short-circuit event are evaluated. The ground test simulation is briefly described along with performance during reconditioning discharges. Results suggest that a characteristic signature develops prior to a shorting event.

A programmable heater control circuit for spacecraft

NASA Technical Reports Server (NTRS)

Nguyen, D. D.; Owen, J. W.; Smith, D. A.; Lewter, W. J.

1994-01-01

Spacecraft thermal control is accomplished for many components through use of multilayer insulation systems, electrical heaters, and radiator systems. The heaters are commanded to maintain component temperatures within design specifications. The programmable heater control circuit (PHCC) was designed to obtain an effective and efficient means of spacecraft thermal control. The hybrid circuit provides use of control instrumentation as temperature data, available to the spacecraft central data system, reprogramming capability of the local microprocessor during the spacecraft's mission, and the elimination of significant spacecraft wiring. The hybrid integrated circuit has a temperature sensing and conditioning circuit, a microprocessor, and a heater power and control circuit. The device is miniature and housed in a volume which allows physical integration with the component to be controlled. Applications might include alternate battery-powered logic-circuit configurations. A prototype unit with appropriate physical and functional interfaces was procured for testing. The physical functionality and the feasibility of fabrication of the hybrid integrated circuit were successfully verified. The remaining work to develop a flight-qualified device includes fabrication and testing of a Mil-certified part. An option for completing the PHCC flight qualification testing is to enter into a joint venture with industry.

Tester Detects Steady-Short Or Intermittent-Open Circuits

NASA Technical Reports Server (NTRS)

Anderson, Bobby L.

1990-01-01

Momentary open circuits or steady short circuits trigger buzzer. Simple, portable, lightweight testing circuit sounds long-duration alarm when it detects steady short circuit or momentary open circuit in coaxial cable or other two-conductor transmission line. Tester sensitive to discontinuities lasting 10 microseconds or longer. Used extensively for detecting intermittent open shorts in accelerometer and extensometer cables. Also used as ordinary buzzer-type continuity checker to detect steady short or open circuits.

SUBSONIC WIND TUNNEL PERFORMANCE ANALYSIS SOFTWARE

NASA Technical Reports Server (NTRS)

Eckert, W. T.

1994-01-01

This program was developed as an aid in the design and analysis of subsonic wind tunnels. It brings together and refines previously scattered and over-simplified techniques used for the design and loss prediction of the components of subsonic wind tunnels. It implements a system of equations for determining the total pressure losses and provides general guidelines for the design of diffusers, contractions, corners and the inlets and exits of non-return tunnels. The algorithms used in the program are applicable to compressible flow through most closed- or open-throated, single-, double- or non-return wind tunnels or ducts. A comparison between calculated performance and that actually achieved by several existing facilities produced generally good agreement. Any system through which air is flowing which involves turns, fans, contractions etc. (e.g., an HVAC system) may benefit from analysis using this software. This program is an update of ARC-11138 which includes PC compatibility and an improved user interface. The method of loss analysis used by the program is a synthesis of theoretical and empirical techniques. Generally, the algorithms used are those which have been substantiated by experimental test. The basic flow-state parameters used by the program are determined from input information about the reference control section and the test section. These parameters were derived from standard relationships for compressible flow. The local flow conditions, including Mach number, Reynolds number and friction coefficient are determined for each end of each component or section. The loss in total pressure caused by each section is calculated in a form non-dimensionalized by local dynamic pressure. The individual losses are based on the nature of the section, local flow conditions and input geometry and parameter information. The loss forms for typical wind tunnel sections considered by the program include: constant area ducts, open throat ducts, contractions, constant area corners, diffusing corners, diffusers, exits, flow straighteners, fans, and fixed, known losses. Input to this program consists of data describing each section; the section type, the section end shapes, the section diameters, and parameters which vary from section to section. Output from the program consists of a tabulation of the performance-related parameters for each section of the wind tunnel circuit and the overall performance values that include the total circuit length, the total pressure losses and energy ratios for the circuit, and the total operating power required. If requested, the output also includes an echo of the input data, a summary of the circuit characteristics and plotted results on the cumulative pressure losses and the wall pressure differentials. The Subsonic Wind Tunnel Performance Analysis Software is written in FORTRAN 77 (71%) and BASIC (29%) for IBM PC series computers and compatibles running MS-DOS 2.1 or higher. The machine requirements include either an 80286 or 80386 processor, a math co-processor and 640K of main memory. The PERFORM analysis software is written for the RM/FORTRAN v2.4 compiler. This portion of the code is portable to other platforms which support a standard FORTRAN 77 compiler. Source code and executables for the PC are included with the distribution. They are compressed using the PKWARE archiving tool; the utility to unarchive the files, PKUNZIP.EXE, is included. With the PERFINTER program interface the user is allowed to enter the wind tunnel characteristics via the menu driven program, but this is only available for the PC. The standard distribution medium for this package is a 5.25 inch 360K MS-DOS format diskette. This software package was developed in 1990. DEC, VAX and VMS are trademarks of Digital Equipment Corporation. RM/FORTRAN is trademark of Ryan McFarland Corporation. PERFORM is a trademark of Prime Computer Inc. MS-DOS is a registered trademark of Microsoft Corporation.

49 CFR 236.51 - Track circuit requirements.

Code of Federal Regulations, 2012 CFR

2012-10-01

..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

49 CFR 236.51 - Track circuit requirements.

Code of Federal Regulations, 2014 CFR

2014-10-01

..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

49 CFR 236.51 - Track circuit requirements.

Code of Federal Regulations, 2013 CFR

2013-10-01

..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

49 CFR 236.51 - Track circuit requirements.

Code of Federal Regulations, 2011 CFR

2011-10-01

..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

49 CFR 236.51 - Track circuit requirements.

Code of Federal Regulations, 2010 CFR

2010-10-01

..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

Addressable-Matrix Integrated-Circuit Test Structure

NASA Technical Reports Server (NTRS)

Sayah, Hoshyar R.; Buehler, Martin G.

1991-01-01

Method of quality control based on use of row- and column-addressable test structure speeds collection of data on widths of resistor lines and coverage of steps in integrated circuits. By use of straightforward mathematical model, line widths and step coverages deduced from measurements of electrical resistances in each of various combinations of lines, steps, and bridges addressable in test structure. Intended for use in evaluating processes and equipment used in manufacture of application-specific integrated circuits.

Physics Notes.

ERIC Educational Resources Information Center

School Science Review, 1980

1980-01-01

Outlines a variety of laboratory procedures, discussions, and demonstrations including a no-solder circuit board, damped to maintained oscillations with L-C circuits, polaroid strobe photos, resistive putty, soldering and circuit checking exercise, electromagnetic radiation, square pulses in C-R circuits, and testing an oscillating system. (GS)

HEMT Amplifiers and Equipment for their On-Wafer Testing

NASA Technical Reports Server (NTRS)

Fung, King man; Gaier, Todd; Samoska, Lorene; Deal, William; Radisic, Vesna; Mei, Xiaobing; Lai, Richard

2008-01-01

Power amplifiers comprising InP-based high-electron-mobility transistors (HEMTs) in coplanar-waveguide (CPW) circuits designed for operation at frequencies of hundreds of gigahertz, and a test set for onwafer measurement of their power levels have been developed. These amplifiers utilize an advanced 35-nm HEMT monolithic microwave integrated-circuit (MMIC) technology and have potential utility as local-oscillator drivers and power sources in future submillimeter-wavelength heterodyne receivers and imaging systems. The test set can reduce development time by enabling rapid output power characterization, not only of these and similar amplifiers, but also of other coplanar-waveguide power circuits, without the necessity of packaging the circuits.

Programmable Low-Voltage Circuit Breaker and Tester

NASA Technical Reports Server (NTRS)

Greenfield, Terry

2008-01-01

An instrumentation system that would comprise a remotely controllable and programmable low-voltage circuit breaker plus several electric-circuit-testing subsystems has been conceived, originally for use aboard a spacecraft during all phases of operation from pre-launch testing through launch, ascent, orbit, descent, and landing. The system could also be adapted to similar use aboard aircraft. In comparison with remotely controllable circuit breakers heretofore commercially available, this system would be smaller, less massive, and capable of performing more functions, as needed for aerospace applications.

Design of low loss helix circuits for interference fitted and brazed circuits

NASA Technical Reports Server (NTRS)

Jacquez, A.

1983-01-01

The RF loss properties and thermal capability of brazed helix circuits and interference fitted circuits were evaluated. The objective was to produce design circuits with minimum RF loss and maximum heat transfer. These circuits were to be designed to operate at 10 kV and at 20 GHz using a gamma a approximately equal to 1.0. This represents a circuit diameter of only 0.75 millimeters. The fabrication of this size circuit and the 0.48 millimeter high support rods required considerable refinements in the assembly techniques and fixtures used on lower frequency circuits. The transition from the helices to the waveguide was designed and the circuits were matched from 20 to 40 GHz since the helix design is a broad band circuit and at a gamma a of 1.0 will operate over this band. The loss measurement was a transmission measurement and therefore had two such transitions. This resulting double-ended match required tuning elements to achieve the broad band match and external E-H tuners at each end to optimize the match for each frequency where the loss measurement was made. The test method used was a substitution method where the test fixture was replaced by a calibrated attenuator.

Hazard-Free Pyrotechnic Simulator

NASA Technical Reports Server (NTRS)

Mcalister, William B., Jr.

1988-01-01

Simulator evaluates performance of firing circuits for electroexplosive devices (EED's) safely and inexpensively. Tests circuits realistically when pyrotechnic squibs not connected and eliminates risks of explosions. Used to test such devices as batteries where test conditions might otherwise degrade them.

Simulated Laboratory in Digital Logic.

ERIC Educational Resources Information Center

Cleaver, Thomas G.

Design of computer circuits used to be a pencil and paper task followed by laboratory tests, but logic circuit design can now be done in half the time as the engineer accesses a program which simulates the behavior of real digital circuits, and does all the wiring and testing on his computer screen. A simulated laboratory in digital logic has been…

Discrete Semiconductor Device Reliability

DTIC Science & Technology

1988-03-25

array or alphanumeric display. "--" indicates unknown diode count. Voc Open circuit voltage for photovoltaic modules . indicates unknown. Isc Short... circuit current for photovoltaic modules . "--" indicates unknown. Number Tested Quantity of parts under the described test or field conditions for that...information pertaining to electronic systems and parts used therein. The present scope includes integrated circuits , hybrids, discrete semiconductors

Assembly and Thermal Hydraulic Test of a Stainless Steel Sodium-Potassium Circuit

NASA Technical Reports Server (NTRS)

Garber, A.; Godfroy, T.; Webster, K.

2007-01-01

Early Flight Fission Test Facilities (EFF-TF) team has been tasked by the NASA Marshall Space Flight Center Nuclear Systems Office to design, fabricate, and test an actively pumped alkali metal flow circuit. The system was originally built for use with lithium, but due to a shift in focus, it was redesigned for use with a eutectic mixture of sodium potassium (NaK). Basic circuit components include: reactor segment, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and a spill reservoir. A 37-pin partial-array core (pin and flow path dimensions are the same as those in a full design) was selected for fabrication and test. This paper summarizes the first fill and checkout testing of the Stainless Steel NaK-Cooled Circuit (SNaKC).

Faster Evolution of More Multifunctional Logic Circuits

NASA Technical Reports Server (NTRS)

Stoica, Adrian; Zebulum, Ricardo

2005-01-01

A modification in a method of automated evolutionary synthesis of voltage-controlled multifunctional logic circuits makes it possible to synthesize more circuits in less time. Prior to the modification, the computations for synthesizing a four-function logic circuit by this method took about 10 hours. Using the method as modified, it is possible to synthesize a six-function circuit in less than half an hour. The concepts of automated evolutionary synthesis and voltage-controlled multifunctional logic circuits were described in a number of prior NASA Tech Briefs articles. To recapitulate: A circuit is designed to perform one of several different logic functions, depending on the value of an applied control voltage. The circuit design is synthesized following an automated evolutionary approach that is so named because it is modeled partly after the repetitive trial-and-error process of biological evolution. In this process, random populations of integer strings that encode electronic circuits play a role analogous to that of chromosomes. An evolved circuit is tested by computational simulation (prior to testing in real hardware to verify a final design). Then, in a fitness-evaluation step, responses of the circuit are compared with specifications of target responses and circuits are ranked according to how close they come to satisfying specifications. The results of the evaluation provide guidance for refining designs through further iteration.

Multiconductor Short/Open Cable Tester

NASA Technical Reports Server (NTRS)

Eichenberg, Dennis

1994-01-01

Frequent or regular testing of multiconductor cables terminated in multipin conductors tedious, if not impossible, task. This inexpensive circuit simplifies open/short testing and is amenable to automation. In operation, pair of connectors selected to match pair of connectors installed on each of cables to be tested. As many connectors accommodated as required, and each can have as many conductors as required. Testing technique implemented with this circuit automated easily with electronic controls and computer interface. Printout provides status of each conductor in cable, indicating which, if any, of conductors has open or short circuit.

KSC-07pd3630

NASA Image and Video Library

2007-12-14

KENNEDY SPACE CENTER, FLA. -- On Launch Pad 39A, a technician checks cables and wires that will be used in the Time Domain Reflectometry, or TDR, test on engine cut-off sensors, or ECO, in space shuttle Atlantis' external tank. The test equipment -- blue monitor at left-- will be used to validate the circuit on the test wiring before hooking it up to the test box. The shuttle's planned launches on Dec. 6 and Dec. 9 were postponed because of false readings from the part of the ECO system that monitors the liquid hydrogen section of the tank. The liftoff date from NASA's Kennedy Space Center, Florida, is now targeted for Jan. 10, depending on the resolution of the problem in the fuel sensor system. Photo credit: NASA/Kim Shiflett

[Development and test of a wheat chlorophyll, nitrogen and water content meter].

PubMed

Yu, Bo; Sun, Ming; Han, Shu-Qing; Xia, Jin-Wen

2011-08-01

A portable meter was developed which can detect chlorophyll, nitrogen and moisture content of wheat leaf simultaneously, and can supply enough data for guiding fertilization and irrigation. This meter is composed of light path and electronic circuit. And this meter uses 660, 940 and 1450 nm LED together with narrow band filters as the active light source. The hardware circuit consists of micro-controller, LED drive circuit, detector, communication circuit, keyboard and LCD circuit. The meter was tested in the field and performed well with good repeatability and accuracy. The relative errors of chlorophyll and nitrogen test were about 10%, relative error for water content was 4%. The coefficients of variation of the three indices were all below 1.5%. All of these prove that the meter can be applied under the field condition to guide the wheat production.

USSR and Eastern Europe Scientific Abstracts, Electronics and Electrical Engineering, Number 27

DTIC Science & Technology

1977-02-10

input and output conditions. The power section of the circuit is modified to permit triacs and thyristors, respectively, to function. The purpose of the...electronic materials, components, and devices, on circuit theory, pulse techniques, electromagnetic wave propagation, radar, quantum electronic theory...Lasers, Masers, Holography, Quasi-Optical 20 Microelectronics and General Circuit Theory and Information 21 Radars and Radio Wavigati on 22

Sunlight and Solar Cells: Teaching Digital Design and Communication through the Development of a Simple Monitoring Station

ERIC Educational Resources Information Center

Downs, Nathan; Parisi, Alfio

2010-01-01

A method is described for building a cost effective digital circuit capable of monitoring the solar radiation incident upon a remote solar cell. The circuit is built in two sections, the first, digitises the analogue voltage produced by the solar cell at a remote location and transmits the received signal to the second receiver circuit which…

Integrated Cryogenic Electronics Testbed (ICE-T) for Evaluation of Superconductor and Cryo-Semiconductor Integrated Circuits

NASA Astrophysics Data System (ADS)

Dotsenko, V. V.; Sahu, A.; Chonigman, B.; Tang, J.; Lehmann, A. E.; Gupta, V.; Talalevskii, A.; Ruotolo, S.; Sarwana, S.; Webber, R. J.; Gupta, D.

2017-02-01

Research and development of cryogenic application-specific integrated circuits (ASICs), such as high-frequency (tens of GHz) semiconductor and superconductor mixed-signal circuits and large-scale (>10,000 Josephson Junctions) superconductor digital circuits, have long been hindered by the absence of specialized cryogenic test apparatus. During their iterative development phase, most ASICs require many additional input-output lines for applying independent bias controls, injecting test signals, and monitoring outputs of different sub-circuits. We are developing a full suite of modular test apparatus based on cryocoolers that do not consume liquid helium, and support extensive electrical interfaces to standard and custom test equipment. Our design separates the cryogenics from electrical connections, allowing even inexperienced users to conduct testing by simply mounting their ASIC on a removable electrical insert. Thermal connections between the cold stages and the inserts are made with robust thermal links. ICE-T accommodates two independent electrical inserts at the same time. We have designed various inserts, such as universal ones with all 40 or 80 coaxial cables and those with customized wiring and temperature-controlled stages. ICE-T features fast thermal cycling for rapid testing, enables detailed testing over long periods (days to months, if necessary), and even supports automated testing of digital ICs with modular additions.

Polymorphic Electronic Circuits

NASA Technical Reports Server (NTRS)

Stoica, Adrian

2004-01-01

Polymorphic electronics is a nascent technological discipline that involves, among other things, designing the same circuit to perform different analog and/or digital functions under different conditions. For example, a circuit can be designed to function as an OR gate or an AND gate, depending on the temperature (see figure). Polymorphic electronics can also be considered a subset of polytronics, which is a broader technological discipline in which optical and possibly other information- processing systems could also be designed to perform multiple functions. Polytronics is an outgrowth of evolvable hardware (EHW). The basic concepts and some specific implementations of EHW were described in a number of previous NASA Tech Briefs articles. To recapitulate: The essence of EHW is to design, construct, and test a sequence of populations of circuits that function as incrementally better solutions of a given design problem through the selective, repetitive connection and/or disconnection of capacitors, transistors, amplifiers, inverters, and/or other circuit building blocks. The evolution is guided by a search-and-optimization algorithm (in particular, a genetic algorithm) that operates in the space of possible circuits to find a circuit that exhibits an acceptably close approximation of the desired functionality. The evolved circuits can be tested by computational simulation (in which case the evolution is said to be extrinsic), tested in real hardware (in which case the evolution is said to be intrinsic), or tested in random sequences of computational simulation and real hardware (in which case the evolution is said to be mixtrinsic).

Electronic Circuit Experiments and SPICE Simulation of Double Covering Bifurcation of 2-Torus Quasi-Periodic Flow in Phase-Locked Loop Circuit

NASA Astrophysics Data System (ADS)

Kamiyama, Kyohei; Endo, Tetsuro; Imai, Isao; Komuro, Motomasa

2016-06-01

Double covering (DC) bifurcation of a 2-torus quasi-periodic flow in a phase-locked loop circuit was experimentally investigated using an electronic circuit and via SPICE simulation; in the circuit, the input radio-frequency signal was frequency modulated by the sum of two asynchronous sinusoidal baseband signals. We observed both DC and period-doubling bifurcations of a discrete map on two Poincaré sections, which were realized by changing the sample timing from one baseband sinusoidal signal to the other. The results confirm the DC bifurcation of the original flow.

Multiple piece turbine blade

DOEpatents

Kimmel, Keith D [Jupiter, FL

2012-05-29

A turbine rotor blade with a spar and shell construction, the spar including an internal cooling supply channel extending from an inlet end on a root section and ending near the tip end, and a plurality of external cooling channels formed on both side of the spar, where a middle external cooling channel is connected to the internal cooling supply channels through a row of holes located at a middle section of the channels. The spar and the shell are held together by hooks that define serpentine flow passages for the cooling air and include an upper serpentine flow circuit and a lower serpentine flow circuit. the serpentine flow circuits all discharge into a leading edge passage or a trailing edge passage.

A Test Methodology for Determining Space-Readiness of Xilinx SRAM-Based FPGA Designs

DOE Office of Scientific and Technical Information (OSTI.GOV)

Quinn, Heather M; Graham, Paul S; Morgan, Keith S

2008-01-01

Using reconfigurable, static random-access memory (SRAM) based field-programmable gate arrays (FPGAs) for space-based computation has been an exciting area of research for the past decade. Since both the circuit and the circuit's state is stored in radiation-tolerant memory, both could be alterd by the harsh space radiation environment. Both the circuit and the circuit's state can be prote cted by triple-moduler redundancy (TMR), but applying TMR to FPGA user designs is often an error-prone process. Faulty application of TMR could cause the FPGA user circuit to output incorrect data. This paper will describe a three-tiered methodology for testing FPGA usermore » designs for space-readiness. We will describe the standard approach to testing FPGA user designs using a particle accelerator, as well as two methods using fault injection and a modeling tool. While accelerator testing is the current 'gold standard' for pre-launch testing, we believe the use of fault injection and modeling tools allows for easy, cheap and uniform access for discovering errors early in the design process.« less

Advanced Space Suit PLSS 2.0 Cooling Loop Evaluation and PLSS 2.5 Recommendations

NASA Technical Reports Server (NTRS)

Steele, John; Quinn, Greg; Campbell, Colin; Makinen, Janice; Watts, Carly; Westheimer, David

2016-01-01

From 2012 to 2015 The NASA/JSC AdvSS (Advanced Space Suit) PLSS (Portable Life Support Subsystem) team, with support from UTC Aerospace Systems, performed the build-up, packaging and testing of PLSS 2.0. One aspect of that testing was the evaluation of the long-term health of the water cooling circuit and the interfacing components. Periodic and end-of-test water, residue and hardware analyses provided valuable information on the status of the water cooling circuit, and the approaches that would be necessary to enhance water cooling circuit health in the future. The evaluated data has been consolidated, interpreted and woven into an action plan for the maintenance of water cooling circuit health for the planned FY (fiscal year) 2016 through FY 2018 PLSS 2.5 testing. This paper provides an overview of the PLSS 2.0 water cooling circuit findings and the associated steps to be taken in that regard for the PLSS 2.5.

Testing Services

NASA Technical Reports Server (NTRS)

1993-01-01

Trace Laboratories is an independent testing laboratory specializing in testing printed circuit boards, automotive products and military hardware. Technical information from NASA Tech Briefs and two subsequent JPL Technical Support packages have assisted Trace in testing surface insulation resistance on printed circuit board materials. Testing time was reduced and customer service was improved because of Jet Propulsion Laboratory technical support packages.

Monolithic circuits for barium fluoride detectors used in nuclear physics experiments. CRADA final report

DOE Office of Scientific and Technical Information (OSTI.GOV)

Varner, R.L.; Blankenship, J.L.; Beene, J.R.

1998-02-01

Custom monolithic electronic circuits have been developed recently for large detector applications in high energy physics where subsystems require tens of thousands of channels of signal processing and data acquisition. In the design and construction of these enormous detectors, it has been found that monolithic circuits offer significant advantages over discrete implementations through increased performance, flexible packaging, lower power and reduced cost per channel. Much of the integrated circuit design for the high energy physics community is directly applicable to intermediate energy heavy-ion and electron physics. This STTR project conducted in collaboration with researchers at the Holifield Radioactive Ion Beammore » Facility (HRIBF) at Oak Ridge National Laboratory, sought to develop a new integrated circuit chip set for barium fluoride (BaF{sub 2}) detector arrays based upon existing CMOS monolithic circuit designs created for the high energy physics experiments. The work under the STTR Phase 1 demonstrated through the design, simulation, and testing of several prototype chips the feasibility of using custom CMOS integrated circuits for processing signals from BaF{sub 2} detectors. Function blocks including charge-sensitive amplifiers, comparators, one shots, time-to-amplitude converters, analog memory circuits and buffer amplifiers were implemented during Phase 1 effort. Experimental results from bench testing and laboratory testing with sources were documented.« less

Passively Shunted Piezoelectric Damping of Centrifugally-Loaded Plates

NASA Technical Reports Server (NTRS)

Duffy, Kirsten P.; Provenza, Andrew J.; Trudell, Jeffrey J.; Min, James B.

2009-01-01

Researchers at NASA Glenn Research Center have been investigating shunted piezoelectric circuits as potential damping treatments for turbomachinery rotor blades. This effort seeks to determine the effects of centrifugal loading on passively-shunted piezoelectric - damped plates. Passive shunt circuit parameters are optimized for the plate's third bending mode. Tests are performed both non-spinning and in the Dynamic Spin Facility to verify the analysis, and to determine the effectiveness of the damping under centrifugal loading. Results show that a resistive shunt circuit will reduce resonant vibration for this configuration. However, a tuned shunt circuit will be required to achieve the desired damping level. The analysis and testing address several issues with passive shunt circuit implementation in a rotating system, including piezoelectric material integrity under centrifugal loading, shunt circuit implementation, and tip mode damping.

Flip-flop resolving time test circuit

NASA Technical Reports Server (NTRS)

Rosenberger, F.; Chaney, T. J.

1982-01-01

Integrated circuit (IC) flip-flop resolving time parameters are measured by wafer probing, without need of dicing or bonding, throught the incorporation of test structures on an IC together with the flip-flop to be measured. Several delays that are fabricated as part of the test circuit, including a voltage-controlled delay with a resolution of a few picosecs, are calibrated as part of the test procedure by integrating them into, and out of, the delay path of a ring oscillator. Each of the delay values is calculated by subtracting the period of the ring oscillator with the delay omitted from the period with the delay included. The delay measurement technique is sufficiently general for other applications. The technique is illustrated for the case of the flip-flop parameters of a 5-micron feature size NMOS circuit.

Quantum dash based single section mode locked lasers for photonic integrated circuits.

PubMed

Joshi, Siddharth; Calò, Cosimo; Chimot, Nicolas; Radziunas, Mindaugas; Arkhipov, Rostislav; Barbet, Sophie; Accard, Alain; Ramdane, Abderrahim; Lelarge, Francois

2014-05-05

We present the first demonstration of an InAs/InP Quantum Dash based single-section frequency comb generator designed for use in photonic integrated circuits (PICs). The laser cavity is closed using a specifically designed Bragg reflector without compromising the mode-locking performance of the self pulsating laser. This enables the integration of single-section mode-locked laser in photonic integrated circuits as on-chip frequency comb generators. We also investigate the relations between cavity modes in such a device and demonstrate how the dispersion of the complex mode frequencies induced by the Bragg grating implies a violation of the equi-distance between the adjacent mode frequencies and, therefore, forbids the locking of the modes in a classical Bragg Device. Finally we integrate such a Bragg Mirror based laser with Semiconductor Optical Amplifier (SOA) to demonstrate the monolithic integration of QDash based low phase noise sources in PICs.

Integrated-circuit balanced parametric amplifier

NASA Technical Reports Server (NTRS)

Dickens, L. E.

1975-01-01

Amplifier, fabricated on single dielectric substrate, has pair of Schottky barrier varactor diodes mounted on single semiconductor chip. Circuit includes microstrip transmission line and slot line section to conduct signals. Main features of amplifier are reduced noise output and low production cost.

Automatic cross-sectioning and monitoring system locates defects in electronic devices

NASA Technical Reports Server (NTRS)

Jacobs, G.; Slaughter, B.

1971-01-01

System consists of motorized grinding and lapping apparatus, sample holder, and electronic control circuit. Low power microscope examines device to pinpoint location of circuit defect, and monitor displays output signal when defect is located exactly.

E-learning platform for automated testing of electronic circuits using signature analysis method

NASA Astrophysics Data System (ADS)

Gherghina, Cǎtǎlina; Bacivarov, Angelica; Bacivarov, Ioan C.; Petricǎ, Gabriel

2016-12-01

Dependability of electronic circuits can be ensured only through testing of circuit modules. This is done by generating test vectors and their application to the circuit. Testability should be viewed as a concerted effort to ensure maximum efficiency throughout the product life cycle, from conception and design stage, through production to repairs during products operating. In this paper, is presented the platform developed by authors for training for testability in electronics, in general and in using signature analysis method, in particular. The platform allows highlighting the two approaches in the field namely analog and digital signature of circuits. As a part of this e-learning platform, it has been developed a database for signatures of different electronic components meant to put into the spotlight different techniques implying fault detection, and from this there were also self-repairing techniques of the systems with this kind of components. An approach for realizing self-testing circuits based on MATLAB environment and using signature analysis method is proposed. This paper analyses the benefits of signature analysis method and simulates signature analyzer performance based on the use of pseudo-random sequences, too.

Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential Circuits

NASA Astrophysics Data System (ADS)

Chen, R. M.; Mahatme, N. N.; Diggins, Z. J.; Wang, L.; Zhang, E. X.; Chen, Y. P.; Liu, Y. N.; Narasimham, B.; Witulski, A. F.; Bhuva, B. L.; Fleetwood, D. M.

2017-08-01

Reductions in single-event (SE) upset (SEU) rates for sequential circuits due to temporal masking effects are evaluated. The impacts of supply voltage, combinational-logic delay, flip-flop (FF) SEU performance, and particle linear energy transfer (LET) values are analyzed for SE cross sections of sequential circuits. Alpha particles and heavy ions with different LET values are used to characterize the circuits fabricated at the 40-nm bulk CMOS technology node. Experimental results show that increasing the delay of the logic circuit present between FFs and decreasing the supply voltage are two effective ways of reducing SE error rates for sequential circuits for particles with low LET values due to temporal masking. SEU-hardened FFs benefit less from temporal masking than conventional FFs. Circuit hardening implications for SEU-hardened and unhardened FFs are discussed.

30 CFR 57.6402 - Deenergized circuits near detonators.

Code of Federal Regulations, 2010 CFR

2010-07-01

... Electric Blasting-Surface and Underground § 57.6402 Deenergized circuits near detonators. Electrical distribution circuits within 50 feet of electric detonators at the blast site shall be deenergized. Such circuits need not be deenergized between 25 to 50 feet of the electric detonators if stray current tests...

Electrical Circuit Tester

DOEpatents

Love, Frank

2006-04-18

An electrical circuit testing device is provided, comprising a case, a digital voltage level testing circuit with a display means, a switch to initiate measurement using the device, a non-shorting switching means for selecting pre-determined electrical wiring configurations to be tested in an outlet, a terminal block, a five-pole electrical plug mounted on the case surface and a set of adapters that can be used for various multiple-pronged electrical outlet configurations for voltages from 100 600 VAC from 50 100 Hz.

Conductive surge testing of circuits and systems

NASA Technical Reports Server (NTRS)

Richman, P.

1980-01-01

Techniques are given for conductive surge testing of powered electronic equipment. The correct definitions of common and normal mode are presented. Testing requires not only spike-surge generators with a suitable range of open-circuit voltage and short-circuit current waveshapes, but also appropriate means, termed couplers, for connecting test surges to the equipment under test. Key among coupler design considerations is minimization of fail positives resulting from reduction in delivered surge energy due to the coupler. Back-filters and the lines on which they are necessary, are considered as well as ground-fault and ground potential rise. A method for monitoring delivered and resulting surge waves is mentioned.

Evaluation of test equipment for the detection of contamination on electronic circuits

NASA Astrophysics Data System (ADS)

Bergendahl, C. G.; Dunn, B. D.

1984-08-01

The reproducibility, sensitivity and ease of operation of test equipment for the detection of ionizable contaminants on the surface of printed circuit assemblies were assessed. The characteristics of the test equipment are described. Soldering fluxes were chosen as contaminants and were applied in controlled amounts to printed-circuit board assemblies possessing two different component populations. Results show that the relationship between equipment readings varies with flux type. Each kind of test equipment gives a good measure of board cleanliness, although reservations exist concerning the interpretation of such results. A test method for the analysis of total (organic and inorganic) halides in solder fluxes is presented.

33 CFR 183.425 - Conductors: General.

Code of Federal Regulations, 2013 CFR

2013-07-01

... than 30 inches. (g) This section does not apply to communications systems; electronic navigation equipment; electronic circuits having a current flow of less than one ampere; conductors which are totally inside an equipment housing; resistance conductors that control circuit amperage; high voltage secondary...

33 CFR 183.425 - Conductors: General.

Code of Federal Regulations, 2012 CFR

2012-07-01

... than 30 inches. (g) This section does not apply to communications systems; electronic navigation equipment; electronic circuits having a current flow of less than one ampere; conductors which are totally inside an equipment housing; resistance conductors that control circuit amperage; high voltage secondary...

33 CFR 183.425 - Conductors: General.

Code of Federal Regulations, 2011 CFR

2011-07-01

... than 30 inches. (g) This section does not apply to communications systems; electronic navigation equipment; electronic circuits having a current flow of less than one ampere; conductors which are totally inside an equipment housing; resistance conductors that control circuit amperage; high voltage secondary...

33 CFR 183.425 - Conductors: General.

Code of Federal Regulations, 2010 CFR

2010-07-01

... than 30 inches. (g) This section does not apply to communications systems; electronic navigation equipment; electronic circuits having a current flow of less than one ampere; conductors which are totally inside an equipment housing; resistance conductors that control circuit amperage; high voltage secondary...

33 CFR 183.425 - Conductors: General.

Code of Federal Regulations, 2014 CFR

2014-07-01

... than 30 inches. (g) This section does not apply to communications systems; electronic navigation equipment; electronic circuits having a current flow of less than one ampere; conductors which are totally inside an equipment housing; resistance conductors that control circuit amperage; high voltage secondary...

Evaluation of an enhanced gravity-based fine-coal circuit for high-sulfur coal

DOE Office of Scientific and Technical Information (OSTI.GOV)

Mohanty, M.K.; Samal, A.R.; Palit, A.

One of the main objectives of this study was to evaluate a fine-coal cleaning circuit using an enhanced gravity separator specifically for a high sulfur coal application. The evaluation not only included testing of individual unit operations used for fine-coal classification, cleaning and dewatering, but also included testing of the complete circuit simultaneously. At a scale of nearly 2 t/h, two alternative circuits were evaluated to clean a minus 0.6-mm coal stream utilizing a 150-mm-diameter classifying cyclone, a linear screen having a projected surface area of 0.5 m{sup 2}, an enhanced gravity separator having a bowl diameter of 250 mmmore » and a screen-bowl centrifuge having a bowl diameter of 500 mm. The cleaning and dewatering components of both circuits were the same; however, one circuit used a classifying cyclone whereas the other used a linear screen as the classification device. An industrial size coal spiral was used to clean the 2- x 0.6-mm coal size fraction for each circuit to estimate the performance of a complete fine-coal circuit cleaning a minus 2-mm particle size coal stream. The 'linear screen + enhanced gravity separator + screen-bowl circuit' provided superior sulfur and ash-cleaning performance to the alternative circuit that used a classifying cyclone in place of the linear screen. Based on these test data, it was estimated that the use of the recommended circuit to treat 50 t/h of minus 2-mm size coal having feed ash and sulfur contents of 33.9% and 3.28%, respectively, may produce nearly 28.3 t/h of clean coal with product ash and sulfur contents of 9.15% and 1.61 %, respectively.« less

Method of boundary testing of the electric circuits and its application for calculating electric tolerances. [electric equipment tests

NASA Technical Reports Server (NTRS)

Redkina, N. P.

1974-01-01

Boundary testing of electric circuits includes preliminary and limiting tests. Preliminary tests permit determination of the critical parameters causing the greatest deviation of the output parameter of the system. The boundary tests offer the possibility of determining the limits of the fitness of the system with simultaneous variation of its critical parameters.

Comparing the Robustness of High-Frequency Traveling-Wave Tube Slow-Wave Circuits

NASA Technical Reports Server (NTRS)

Chevalier, Christine T.; Wilson, Jeffrey D.; Kory, Carol L.

2007-01-01

A three-dimensional electromagnetic field simulation software package was used to compute the cold-test parameters, phase velocity, on-axis interaction impedance, and attenuation, for several high-frequency traveling-wave tube slow-wave circuit geometries. This research effort determined the effects of variations in circuit dimensions on cold-test performance. The parameter variations were based on the tolerances of conventional micromachining techniques.

Use of vacuum tubes in test instrumentation for measuring characteristics of fast high-voltage semiconductor devices

NASA Technical Reports Server (NTRS)

Berning, D.

1981-01-01

Circuits are described that permit measurement of fast events occurring in power semiconductors. These circuits were developed for the dynamic characterization of transistors used in inductive-load switching applications. Fast voltage clamping using vacuum diodes is discussed, and reference is made to a unique circuit that was built for performing nondestructive, reverse-bias, second-breakdown tests on transistors.

Algebraic method for parameter identification of circuit models for batteries under non-zero initial condition

NASA Astrophysics Data System (ADS)

Devarakonda, Lalitha; Hu, Tingshu

2014-12-01

This paper presents an algebraic method for parameter identification of Thevenin's equivalent circuit models for batteries under non-zero initial condition. In traditional methods, it was assumed that all capacitor voltages have zero initial conditions at the beginning of each charging/discharging test. This would require a long rest time between two tests, leading to very lengthy tests for a charging/discharging cycle. In this paper, we propose an algebraic method which can extract the circuit parameters together with initial conditions. This would theoretically reduce the rest time to 0 and substantially accelerate the testing cycles.

Energy-efficient neuron, synapse and STDP integrated circuits.

PubMed

Cruz-Albrecht, Jose M; Yung, Michael W; Srinivasa, Narayan

2012-06-01

Ultra-low energy biologically-inspired neuron and synapse integrated circuits are presented. The synapse includes a spike timing dependent plasticity (STDP) learning rule circuit. These circuits have been designed, fabricated and tested using a 90 nm CMOS process. Experimental measurements demonstrate proper operation. The neuron and the synapse with STDP circuits have an energy consumption of around 0.4 pJ per spike and synaptic operation respectively.

Wireless power transfer system

DOEpatents

Wu, Hunter; Sealy, Kylee; Gilchrist, Aaron

2016-02-23

A system includes a first stage of an inductive power transfer system with an LCL load resonant converter with a switching section, an LCL tuning circuit, and a primary receiver pad. The IPT system includes a second stage with a secondary receiver pad, a secondary resonant circuit, a secondary rectification circuit, and a secondary decoupling converter. The secondary receiver pad connects to the secondary resonant circuit. The secondary resonant circuit connects to the secondary rectification circuit. The secondary rectification circuit connects to the secondary decoupling converter. The second stage connects to a load. The load includes an energy storage element. The second stage and load are located on a vehicle and the first stage is located at a fixed location. The primary receiver pad wirelessly transfers power to the secondary receiver pad across a gap when the vehicle positions the secondary receiver pad with respect to the primary receiver pad.

Printed circuit board impedance matching step for microwave (millimeter wave) devices

DOEpatents

Pao, Hsueh-Yuan; Aguirre, Jerardo; Sargis, Paul

2013-10-01

An impedance matching ground plane step, in conjunction with a quarter wave transformer section, in a printed circuit board provides a broadband microwave matching transition from board connectors or other elements that require thin substrates to thick substrate (>quarter wavelength) broadband microwave (millimeter wave) devices. A method of constructing microwave and other high frequency electrical circuits on a substrate of uniform thickness, where the circuit is formed of a plurality of interconnected elements of different impedances that individually require substrates of different thicknesses, by providing a substrate of uniform thickness that is a composite or multilayered substrate; and forming a pattern of intermediate ground planes or impedance matching steps interconnected by vias located under various parts of the circuit where components of different impedances are located so that each part of the circuit has a ground plane substrate thickness that is optimum while the entire circuit is formed on a substrate of uniform thickness.

Numerical investigation of air flow in a supersonic wind tunnel

NASA Astrophysics Data System (ADS)

Drozdov, S. M.; Rtishcheva, A. S.

2017-11-01

In the framework of TsAGI’s supersonic wind tunnel modernization program aimed at improving flow quality and extending the range of test regimes it was required to design and numerically validate a new test section and a set of shaped nozzles: two flat nozzles with flow Mach number at nozzle exit M=4 and M=5 and two axisymmetric nozzles with M=5 and M=6. Geometric configuration of the nozzles, the test section (an Eiffel chamber) and the diffuser was chosen according to the results of preliminary calculations of two-dimensional air flow in the wind tunnel circuit. The most important part of the work are three-dimensional flow simulation results obtained using ANSYS Fluent software. The following flow properties were investigated: Mach number, total and static pressure, total and static temperature and turbulent viscosity ratio distribution, heat flux density at wind tunnel walls (for high-temperature flow regimes). It is demonstrated that flow perturbations emerging from the junction of the nozzle with the test section and spreading down the test section behind the boundaries of characteristic rhomb’s reverse wedge are nearly impossible to eliminate. Therefore, in order to perform tests under most uniform flow conditions, the model’s center of rotation and optical window axis should be placed as close to the center of the characteristic rhomb as possible. The obtained results became part of scientific and technical basis of supersonic wind tunnel design process and were applied to a generalized class of similar wind tunnels.

Three-Dimensional Simulation of Traveling-Wave Tube Cold-Test Characteristics Using MAFIA

NASA Technical Reports Server (NTRS)

Kory, Carol L.; Wilson, Jeffrey D.

1995-01-01

The three-dimensional simulation code MAFIA was used to compute the cold-test parameters - frequency-phase dispersion, beam on-axis interaction impedance, and attenuation - for two types of traveling-wave tube (TWT) slow-wave circuits. The potential for this electromagnetic computer modeling code to reduce the time and cost of TWT development is demonstrated by the high degree of accuracy achieved in calculating these parameters. Generalized input files were developed for ferruled coupled-cavity and TunneLadder slow-wave circuits. These files make it easy to model circuits of arbitrary dimensions. The utility of these files was tested by applying each to a specific TWT slow-wave circuit and comparing the results with experimental data. Excellent agreement was obtained.

Prolonged 500 C Operation of 100+ Transistor Silicon Carbide Integrated Circuits

NASA Technical Reports Server (NTRS)

Spry, David J.; Neudeck, Philip G.; Lukco, Dorothy; Chen, Liangyu; Krasowski, Michael J.; Prokop, Norman F.; Chang, Carl W.; Beheim, Glenn M.

2017-01-01

This report describes more than 5000 hours of successful 500 C operation of semiconductor integrated circuits (ICs) with more than 100 transistors. Multiple packaged chips with two different 4H-SiC junction field effect transistor (JFET) technology demonstrator circuits have surpassed thousands of hours of oven-testing at 500 C. After 100 hours of 500 C burn-in, the circuits (except for 2 failures) exhibit less than 10% change in output characteristics for the remainder of 500 C testing. We also describe the observation of important differences in IC materials durability when subjected to the first nine constituents of Venus-surface atmosphere at 9.4 MPa and 460 C in comparison to what is observed for Earth-atmosphere oven testing at 500 C.

Prolonged 500 C Operation of 100+ Transistor Silicon Carbide Integrated Circuits

NASA Technical Reports Server (NTRS)

Spry, David J.; Neudeck, Philip G.; Lukco, Dorothy; Chen, Liangyu; Krasowski, Michael J.; Prokop, Norman F.; Chang, Carl W.; Beheim, Glenn M.

2017-01-01

This report describes more than 5000 hours of successful 500 C operation of semiconductor integrated circuits (ICs) with more than 100 transistors. Multiple packaged chips with two different 4H-SiC junction field effect transistor (JFET) technology demonstrator circuits have surpassed thousands of hours of oven-testing at 500 C. After 100 hours of 500 C burn-in, the circuits (except for 2 failures) exhibit less than 10 change in output characteristics for the remainder of 500C testing. We also describe the observation of important differences in IC materials durability when subjected to the first nine constituents of Venus-surface atmosphere at 9.4 MPa and 460C in comparison to what is observed for Earth-atmosphere oven testing at 500 C.

An adjustable RF tuning element for microwave, millimeter wave, and submillimeter wave integrated circuits

NASA Technical Reports Server (NTRS)

Lubecke, Victor M.; Mcgrath, William R.; Rutledge, David B.

1991-01-01

Planar RF circuits are used in a wide range of applications from 1 GHz to 300 GHz, including radar, communications, commercial RF test instruments, and remote sensing radiometers. These circuits, however, provide only fixed tuning elements. This lack of adjustability puts severe demands on circuit design procedures and materials parameters. We have developed a novel tuning element which can be incorporated into the design of a planar circuit in order to allow active, post-fabrication tuning by varying the electrical length of a coplanar strip transmission line. It consists of a series of thin plates which can slide in unison along the transmission line, and the size and spacing of the plates are designed to provide a large reflection of RF power over a useful frequency bandwidth. Tests of this structure at 1 GHz to 3 Ghz showed that it produced a reflection coefficient greater than 0.90 over a 20 percent bandwidth. A 2 GHz circuit incorporating this tuning element was also tested to demonstrate practical tuning ranges. This structure can be fabricated for frequencies as high as 1000 GHz using existing micromachining techniques. Many commercial applications can benefit from this micromechanical RF tuning element, as it will aid in extending microwave integrated circuit technology into the high millimeter wave and submillimeter wave bands by easing constraints on circuit technology.

47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

Code of Federal Regulations, 2013 CFR

2013-10-01

... 47 Telecommunication 5 2013-10-01 2013-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

Code of Federal Regulations, 2012 CFR

2012-10-01

... 47 Telecommunication 5 2012-10-01 2012-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

Code of Federal Regulations, 2014 CFR

2014-10-01

... 47 Telecommunication 5 2014-10-01 2014-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

47 CFR 80.867 - Ship station tools, instruction books, circuit diagrams and testing equipment.

Code of Federal Regulations, 2010 CFR

2010-10-01

... 47 Telecommunication 5 2010-10-01 2010-10-01 false Ship station tools, instruction books, circuit... Requirements for Cargo Vessels Not Subject to Subpart W § 80.867 Ship station tools, instruction books, circuit..., instruction books and circuit diagrams to enable the radiotelephone installation to be maintained in efficient...

In Vitro Simulation and Validation of the Circulation with Congenital Heart Defects

PubMed Central

Figliola, Richard S.; Giardini, Alessandro; Conover, Tim; Camp, Tiffany A.; Biglino, Giovanni; Chiulli, John; Hsia, Tain-Yen

2010-01-01

Despite the recent advances in computational modeling, experimental simulation of the circulation with congenital heart defect using mock flow circuits remains an important tool for device testing, and for detailing the probable flow consequences resulting from surgical and interventional corrections. Validated mock circuits can be applied to qualify the results from novel computational models. New mathematical tools, coupled with advanced clinical imaging methods, allow for improved assessment of experimental circuit performance relative to human function, as well as the potential for patient-specific adaptation. In this review, we address the development of three in vitro mock circuits specific for studies of congenital heart defects. Performance of an in vitro right heart circulation circuit through a series of verification and validation exercises is described, including correlations with animal studies, and quantifying the effects of circuit inertiance on test results. We present our experience in the design of mock circuits suitable for investigations of the characteristics of the Fontan circulation. We use one such mock circuit to evaluate the accuracy of Doppler predictions in the presence of aortic coarctation. PMID:21218147

Cable Crosstalk Suppression with Two-Wire Voltage Feedback Method for Resistive Sensor Array

PubMed Central

Wu, Jianfeng; He, Shangshang; Li, Jianqing; Song, Aiguo

2016-01-01

Using a long, flexible test cable connected with a one-wire voltage feedback circuit, a resistive tactile sensor in a shared row-column fashion exhibited flexibility in robotic operations but suffered from crosstalk caused by the connected cable due to its wire resistances and its contacted resistances. Firstly, we designed a new non-scanned driving-electrode (VF-NSDE) circuit using two wires for every row line and every column line to reduce the crosstalk caused by the connected cables in the circuit. Then, an equivalent resistance expression of the element being tested (EBT) for the two-wire VF-NSDE circuit was analytically derived. Following this, the one-wire VF-NSDE circuit and the two-wire VF-NSDE circuit were evaluated by simulation experiments. Finally, positive features of the proposed method were verified with the experiments of a two-wire VF-NSDE prototype circuit. The experiment results show that the two-wire VF-NSDE circuit can greatly reduce the crosstalk error caused by the cables in the 2-D networked resistive sensor array. PMID:26907279

30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

Code of Federal Regulations, 2011 CFR

2011-07-01

... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such record... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2011 CFR

2011-07-01

... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating current... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

Code of Federal Regulations, 2010 CFR

2010-07-01

... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such record... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

Code of Federal Regulations, 2010 CFR

2010-07-01

... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating current... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

47 CFR 15.32 - Test procedures for CPU boards and computer power supplies.

Code of Federal Regulations, 2011 CFR

2011-10-01

... result in a complete personal computer system. If the oscillator and the microprocessor circuits are... microprocessor circuits are contained on separate circuit boards, both boards, typical of the combination that...

47 CFR 15.32 - Test procedures for CPU boards and computer power supplies.

Code of Federal Regulations, 2013 CFR

2013-10-01

... result in a complete personal computer system. If the oscillator and the microprocessor circuits are... microprocessor circuits are contained on separate circuit boards, both boards, typical of the combination that...

47 CFR 15.32 - Test procedures for CPU boards and computer power supplies.

Code of Federal Regulations, 2014 CFR

2014-10-01

... result in a complete personal computer system. If the oscillator and the microprocessor circuits are... microprocessor circuits are contained on separate circuit boards, both boards, typical of the combination that...

47 CFR 15.32 - Test procedures for CPU boards and computer power supplies.

Code of Federal Regulations, 2012 CFR

2012-10-01

... result in a complete personal computer system. If the oscillator and the microprocessor circuits are... microprocessor circuits are contained on separate circuit boards, both boards, typical of the combination that...

47 CFR 15.32 - Test procedures for CPU boards and computer power supplies.

Code of Federal Regulations, 2010 CFR

2010-10-01

... result in a complete personal computer system. If the oscillator and the microprocessor circuits are... microprocessor circuits are contained on separate circuit boards, both boards, typical of the combination that...

Compiling quantum circuits to realistic hardware architectures using temporal planners

NASA Astrophysics Data System (ADS)

Venturelli, Davide; Do, Minh; Rieffel, Eleanor; Frank, Jeremy

2018-04-01

To run quantum algorithms on emerging gate-model quantum hardware, quantum circuits must be compiled to take into account constraints on the hardware. For near-term hardware, with only limited means to mitigate decoherence, it is critical to minimize the duration of the circuit. We investigate the application of temporal planners to the problem of compiling quantum circuits to newly emerging quantum hardware. While our approach is general, we focus on compiling to superconducting hardware architectures with nearest neighbor constraints. Our initial experiments focus on compiling Quantum Alternating Operator Ansatz (QAOA) circuits whose high number of commuting gates allow great flexibility in the order in which the gates can be applied. That freedom makes it more challenging to find optimal compilations but also means there is a greater potential win from more optimized compilation than for less flexible circuits. We map this quantum circuit compilation problem to a temporal planning problem, and generated a test suite of compilation problems for QAOA circuits of various sizes to a realistic hardware architecture. We report compilation results from several state-of-the-art temporal planners on this test set. This early empirical evaluation demonstrates that temporal planning is a viable approach to quantum circuit compilation.

Measurements by a Vector Network Analyzer at 325 to 508 GHz

NASA Technical Reports Server (NTRS)

Fung, King Man; Samoska, Lorene; Chattopadhyay, Goutam; Gaier, Todd; Kangaslahti, Pekka; Pukala, David; Lau, Yuenie; Oleson, Charles; Denning, Anthony

2008-01-01

Recent experiments were performed in which return loss and insertion loss of waveguide test assemblies in the frequency range from 325 to 508 GHz were measured by use of a swept-frequency two-port vector network analyzer (VNA) test set. The experiments were part of a continuing effort to develop means of characterizing passive and active electronic components and systems operating at ever increasing frequencies. The waveguide test assemblies comprised WR-2.2 end sections collinear with WR-3.3 middle sections. The test set, assembled from commercially available components, included a 50-GHz VNA scattering- parameter test set and external signal synthesizers, augmented with recently developed frequency extenders, and further augmented with attenuators and amplifiers as needed to adjust radiofrequency and intermediate-frequency power levels between the aforementioned components. The tests included line-reflect-line calibration procedures, using WR-2.2 waveguide shims as the "line" standards and waveguide flange short circuits as the "reflect" standards. Calibrated dynamic ranges somewhat greater than about 20 dB for return loss and 35 dB for insertion loss were achieved. The measurement data of the test assemblies were found to substantially agree with results of computational simulations.

Evaluation of the Langley 4- by 7-meter tunnel for propeller noise measurements

NASA Technical Reports Server (NTRS)

Block, P. J. W.; Gentry, G. L., Jr.

1984-01-01

An experimental and theoretical evaluation of the Langley 4- by 7- Meter Tunnel was conducted to determine its suitability for obtaining propeller noise data. The tunnel circuit and open test section are described. An experimental evaluation is performed using microphones placed in and on the tunnel floor. The reflection characteristics and background noise are determined. The predicted source (propeller) near-field/far-field boundary is given using a first-principles method. The effect of the tunnel-floor boundry layer on the noise from the propeller is also predicted. A propeller test stand used for part of his evaluation is also described. The measured propeller performance characteristics are compared with those obtained at a larger scale, and the effect of the test-section configuration on the propeller performance is examined. Finally, propeller noise measurements were obtained on an eight-bladed SR-2 propeller operating at angles of attack -8 deg, 0 deg, and 4.6 deg to give an indication of attainable signal-to-noise ratios.

30 CFR 75.601-1 - Short circuit protection; ratings and settings of circuit breakers.

Code of Federal Regulations, 2011 CFR

2011-07-01

... (amperes) 14 50 12 75 10 150 8 200 6 300 4 500 3 600 2 800 1 1,000 1/0 1,250 2/0 1,500 3/0 2,000 4/0 2,500... of circuit breakers. 75.601-1 Section 75.601-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES...

Modular control subsystems for use in solar heating systems for multi-family dwellings

NASA Technical Reports Server (NTRS)

1977-01-01

Progress in the development of solar heating modular control subsystems is reported. Circuit design, circuit drawings, and printed circuit board layout are discussed along with maintenance manuals, installation instructions, and verification and acceptance tests. Calculations made to determine the predicted performance of the differential thermostat are given including details and results of tests for the offset temperature, and boil and freeze protect points.

Selection of wires and circuit protective devices for STS Orbiter vehicle payload electrical circuits

NASA Technical Reports Server (NTRS)

Gaston, Darilyn M.

1991-01-01

Electrical designers of Orbiter payloads face the challenge of determining proper circuit protection/wire size parameters to satisfy Orbiter engineering and safety requirements. This document is the result of a program undertaken to review test data from all available aerospace sources and perform additional testing to eliminate extrapolation errors. The resulting compilation of data was used to develop guidelines for the selection of wire sizes and circuit protection ratings. The purpose is to provide guidance to the engineering to ensure a design which meets Orbiter standards and which should be applicable to any aerospace design.

Simulation of TunneLadder traveling-wave tube cold-test characteristics: Implementation of the three-dimensional, electromagnetic circuit analysis code micro-SOS

NASA Technical Reports Server (NTRS)

Kory, Carol L.; Wilson, Jeffrey D.

1993-01-01

The three-dimensional, electromagnetic circuit analysis code, Micro-SOS, can be used to reduce expensive time-consuming experimental 'cold-testing' of traveling-wave tube (TWT) circuits. The frequency-phase dispersion characteristics and beam interaction impedance of a TunneLadder traveling-wave tube slow-wave structure were simulated using the code. When reasonable dimensional adjustments are made, computer results agree closely with experimental data. Modifications to the circuit geometry that would make the TunneLadder TWT easier to fabricate for higher frequency operation are explored.

Experimental investigation on the thermal performance of Si micro-heat pipe with different cross-sections

NASA Astrophysics Data System (ADS)

Hamidnia, Mohammad; Luo, Yi; Wang, Xiaodong; Li, Congming

2017-10-01

Increasing component densities of the integrated circuit (IC) and packaging levels has led to thermal management problems. Si substrates with embedded micro-heat pipes (MHPs) couple good thermal characteristics and cost savings associated with IC batch processing. The thermal performance of MHP is intimately related to the cross-sectional geometry. Different cross-sections are designed in order to enhance the backflow of working fluid. In this experimental study, three different Si MHPs with same hydraulic diameter and various cross-sections are fabricated by micro-fabrication methods and tested under different conditions of fluid charge ratios. The results show that the trapezoidal MHP associated with rectangular artery which is charged with 40% of vapor chamber’s volume has the best thermal performance. This silicon-based MHP is a passive approach for thermal management, which could widen applications in the commercial electronics industry and LED lightings.

Gas electron multiplier (GEM) foil test, repair and effective gain calculation

NASA Astrophysics Data System (ADS)

Tahir, Muhammad; Zubair, Muhammad; Khan, Tufail A.; Khan, Ashfaq; Malook, Asad

2018-06-01

The focus of my research is based on the gas electron multiplier (GEM) foil test, repairing and effective gain calculation of GEM detector. During my research work define procedure of GEM foil testing short-circuit, detection short-circuits in the foil. Study different ways to remove the short circuits in the foils. Set and define the GEM foil testing procedures in the open air, and with nitrogen gas. Measure the leakage current of the foil and applying different voltages with specified step size. Define the Quality Control (QC) tests and different components of GEM detectors before assembly. Calculate the effective gain of GEM detectors using 109Cd and 55Fe radioactive source.

30 CFR 77.903 - Disconnecting devices.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Disconnecting devices. 77.903 Section 77.903... Medium-Voltage Alternating Current Circuits § 77.903 Disconnecting devices. Disconnecting devices shall be installed in circuits supplying power to portable or mobile equipment and shall provide visual...

40 CFR 413.80 - Applicability: Description of the printed circuit board subcategory.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 40 Protection of Environment 28 2010-07-01 2010-07-01 true Applicability: Description of the printed circuit board subcategory. 413.80 Section 413.80 Protection of Environment ENVIRONMENTAL PROTECTION AGENCY (CONTINUED) EFFLUENT GUIDELINES AND STANDARDS ELECTROPLATING POINT SOURCE CATEGORY Printed...

30 CFR 56.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Grounding circuit enclosures. 56.12025 Section 56.12025 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Grounding circuit enclosures. 56.12025 Section 56.12025 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Grounding circuit enclosures. 56.12025 Section 56.12025 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Grounding circuit enclosures. 56.12025 Section 56.12025 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12001 - Circuit overload protection.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12001 - Circuit overload protection.

Code of Federal Regulations, 2012 CFR

2012-07-01

... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12001 - Circuit overload protection.

Code of Federal Regulations, 2010 CFR

2010-07-01

... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12001 - Circuit overload protection.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12025 - Grounding circuit enclosures.

Code of Federal Regulations, 2011 CFR

2011-07-01

... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Grounding circuit enclosures. 56.12025 Section 56.12025 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

30 CFR 56.12001 - Circuit overload protection.

Code of Federal Regulations, 2014 CFR

2014-07-01

... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

75 FR 38857 - Self-Regulatory Organizations; The NASDAQ Stock Market LLC; Notice of Filing of Proposed Rule...

Federal Register 2010, 2011, 2012, 2013, 2014

2010-07-06

... Pricing for Direct Circuit Connections June 28, 2010. Pursuant to Section 19(b)(1) of the Securities... proposed rule change to establish pricing for 10Gb direct circuit connections and codify pricing for 10Gb...

47 CFR 32.2212 - Digital electronic switching.

Code of Federal Regulations, 2012 CFR

2012-10-01

... shall include the original cost of digital electronic switching equipment used to provide circuit... electronic switching equipment used to provide both circuit and packet switching shall be recorded in the... 47 Telecommunication 2 2012-10-01 2012-10-01 false Digital electronic switching. 32.2212 Section...

47 CFR 32.2212 - Digital electronic switching.

Code of Federal Regulations, 2014 CFR

2014-10-01

... shall include the original cost of digital electronic switching equipment used to provide circuit... electronic switching equipment used to provide both circuit and packet switching shall be recorded in the... 47 Telecommunication 2 2014-10-01 2014-10-01 false Digital electronic switching. 32.2212 Section...

47 CFR 32.2212 - Digital electronic switching.

Code of Federal Regulations, 2011 CFR

2011-10-01

... shall include the original cost of digital electronic switching equipment used to provide circuit... electronic switching equipment used to provide both circuit and packet switching shall be recorded in the... 47 Telecommunication 2 2011-10-01 2011-10-01 false Digital electronic switching. 32.2212 Section...

47 CFR 32.2212 - Digital electronic switching.

Code of Federal Regulations, 2010 CFR

2010-10-01

... shall include the original cost of digital electronic switching equipment used to provide circuit... electronic switching equipment used to provide both circuit and packet switching shall be recorded in the... 47 Telecommunication 2 2010-10-01 2010-10-01 false Digital electronic switching. 32.2212 Section...

47 CFR 32.2212 - Digital electronic switching.

Code of Federal Regulations, 2013 CFR

2013-10-01

... shall include the original cost of digital electronic switching equipment used to provide circuit... electronic switching equipment used to provide both circuit and packet switching shall be recorded in the... 47 Telecommunication 2 2013-10-01 2013-10-01 false Digital electronic switching. 32.2212 Section...

Understanding Biological Regulation Through Synthetic Biology.

PubMed

Bashor, Caleb J; Collins, James J

2018-05-20

Engineering synthetic gene regulatory circuits proceeds through iterative cycles of design, building, and testing. Initial circuit designs must rely on often-incomplete models of regulation established by fields of reductive inquiry-biochemistry and molecular and systems biology. As differences in designed and experimentally observed circuit behavior are inevitably encountered, investigated, and resolved, each turn of the engineering cycle can force a resynthesis in understanding of natural network function. Here, we outline research that uses the process of gene circuit engineering to advance biological discovery. Synthetic gene circuit engineering research has not only refined our understanding of cellular regulation but furnished biologists with a toolkit that can be directed at natural systems to exact precision manipulation of network structure. As we discuss, using circuit engineering to predictively reorganize, rewire, and reconstruct cellular regulation serves as the ultimate means of testing and understanding how cellular phenotype emerges from systems-level network function.

Development of design, qualification, screening, and application requirements for plastic encapsulated solid-state devices for space applications

NASA Astrophysics Data System (ADS)

1981-12-01

Test data were collected on 1035 plastic encapsulated devices and 75 hermetically scaled control group devices that were purchased from each of five different manufacturers in the categories of (1) low power Schottsky TTL (bipolar) digital circuits; (2) CMOS digital circuits; (3) operational amplifier linear circuits; and (4) NPN transistors. These parts were subjected to three different initial screening conditions, then to extended life testing, to determine any possible advantages or trends for any particular screen. Several tests were carried out in the areas of flammability testing, humidity testing, high pressure steam (auroclave) testing, and high temperature storage testing. Test results are presented. Procurement and application considerations for use of plastic encapsulated semiconductors are presented and a statistical analysis program written to study the log normal distributions resulting from life testing is concluded.

Development of design, qualification, screening, and application requirements for plastic encapsulated solid-state devices for space applications

NASA Technical Reports Server (NTRS)

1981-01-01

Test data were collected on 1035 plastic encapsulated devices and 75 hermetically scaled control group devices that were purchased from each of five different manufacturers in the categories of (1) low power Schottsky TTL (bipolar) digital circuits; (2) CMOS digital circuits; (3) operational amplifier linear circuits; and (4) NPN transistors. These parts were subjected to three different initial screening conditions, then to extended life testing, to determine any possible advantages or trends for any particular screen. Several tests were carried out in the areas of flammability testing, humidity testing, high pressure steam (auroclave) testing, and high temperature storage testing. Test results are presented. Procurement and application considerations for use of plastic encapsulated semiconductors are presented and a statistical analysis program written to study the log normal distributions resulting from life testing is concluded.

An evaluation of proposed acoustic treatments for the NASA LaRC 4 x 7 meter wind tunnel

NASA Technical Reports Server (NTRS)

Abrahamson, A. L.

1985-01-01

The NASA LaRC 4 x 7 Meter Wind Tunnel is an existing facility specially designed for powered low speed (V/STOL) testing of large scale fixed wing and rotorcraft models. The enhancement of the facility for scale model acoustic testing is examined. The results are critically reviewed and comparisons are drawn with a similar wind tunnel (the DNW Facility in the Netherlands). Discrepancies observed in the comparison stimulated a theoretical investigation using the acoustic finite element ADAM System, of the ways in which noise propagating around the tunnel circuit radiates into the open test section. The reasons for the discrepancies noted above are clarified and assists in the selection of acoustic treatment options for the facility.

Active pixel sensor array with multiresolution readout

NASA Technical Reports Server (NTRS)

Fossum, Eric R. (Inventor); Kemeny, Sabrina E. (Inventor); Pain, Bedabrata (Inventor)

1999-01-01

An imaging device formed as a monolithic complementary metal oxide semiconductor integrated circuit in an industry standard complementary metal oxide semiconductor process, the integrated circuit including a focal plane array of pixel cells, each one of the cells including a photogate overlying the substrate for accumulating photo-generated charge in an underlying portion of the substrate and a charge coupled device section formed on the substrate adjacent the photogate having a sensing node and at least one charge coupled device stage for transferring charge from the underlying portion of the substrate to the sensing node. There is also a readout circuit, part of which can be disposed at the bottom of each column of cells and be common to all the cells in the column. The imaging device can also include an electronic shutter formed on the substrate adjacent the photogate, and/or a storage section to allow for simultaneous integration. In addition, the imaging device can include a multiresolution imaging circuit to provide images of varying resolution. The multiresolution circuit could also be employed in an array where the photosensitive portion of each pixel cell is a photodiode. This latter embodiment could further be modified to facilitate low light imaging.

Life test of a nickel cadmium battery with a protection/reconditioning circuit

NASA Technical Reports Server (NTRS)

Lanier, J. R., Jr.; Bush, J. R., Jr.

1981-01-01

Results are discussed for a Ni-Cd battery test over a period of 8 years, 2 months and 44,213 simulated low Earth orbits. The battery cells were protected against overdischarge and reversal at discharge rates up to 25 amperes (1.25C) by a battery protection and reconditioning circuit. The circuit performed flawlessly during the test, and proved its value, both as a battery reconditioner and a cell protection device. Battery cell failures are also discussed. The test demonstrated the viability of using Ni-Cd batteries at depth-of-discharge up to 25 percent for over 5 years in a low Earth orbit.

Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits

NASA Technical Reports Server (NTRS)

Kory, Carol L.; Dayton, James A., Jr.

1997-01-01

Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional electromagnetic computer code, MAFIA. Cold-test parameters have been calculated for several helical traveling-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making it possible, for the first time, to design a complete TWT via computer simulation.

Analysis and elimination method of the effects of cables on LVRT testing for offshore wind turbines

NASA Astrophysics Data System (ADS)

Jiang, Zimin; Liu, Xiaohao; Li, Changgang; Liu, Yutian

2018-02-01

The current state, characteristics and necessity of the low voltage ride through (LVRT) on-site testing for grid-connected offshore wind turbines are introduced firstly. Then the effects of submarine cables on the LVRT testing are analysed based on the equivalent circuit of the testing system. A scheme for eliminating the effects of cables on the proposed LVRT testing method is presented. The specified voltage dips are guaranteed to be in compliance with the testing standards by adjusting the ratio between the current limiting impedance and short circuit impedance according to the steady voltage relationship derived from the equivalent circuit. Finally, simulation results demonstrate that the voltage dips at the high voltage side of wind turbine transformer satisfy the requirements of testing standards.

Mechanisms to medicines: elucidating neural and molecular substrates of fear extinction to identify novel treatments for anxiety disorders

PubMed Central

Bukalo, Olena; Pinard, Courtney R; Holmes, Andrew

2014-01-01

The burden of anxiety disorders is growing, but the efficacy of available anxiolytic treatments remains inadequate. Cognitive behavioural therapy for anxiety disorders focuses on identifying and modifying maladaptive patterns of thinking and behaving, and has a testable analogue in rodents in the form of fear extinction. A large preclinical literature has amassed in recent years describing the neural and molecular basis of fear extinction in rodents. In this review, we discuss how this work is being harnessed to foster translational research on anxiety disorders and facilitate the search for new anxiolytic treatments. We begin by summarizing the anatomical and functional connectivity of a medial prefrontal cortex (mPFC)–amygdala circuit that subserves fear extinction, including new insights from optogenetics. We then cover some of the approaches that have been taken to model impaired fear extinction and associated impairments with mPFC–amygdala dysfunction. The principal goal of the review is to evaluate evidence that various neurotransmitter and neuromodulator systems mediate fear extinction by modulating the mPFC–amygdala circuitry. To that end, we describe studies that have tested how fear extinction is impaired or facilitated by pharmacological manipulations of dopamine, noradrenaline, 5-HT, GABA, glutamate, neuropeptides, endocannabinoids and various other systems, which either directly target the mPFC–amygdala circuit, or produce behavioural effects that are coincident with functional changes in the circuit. We conclude that there are good grounds to be optimistic that the progress in defining the molecular substrates of mPFC–amygdala circuit function can be effectively leveraged to identify plausible candidates for extinction-promoting therapies for anxiety disorders. Linked Articles This article is part of a themed section on Animal Models in Psychiatry Research. To view the other articles in this section visit http://dx.doi.org/10.1111/bph.2014.171.issue-20 PMID:24835117

[Modeling and analysis of volume conduction based on field-circuit coupling].

PubMed

Tang, Zhide; Liu, Hailong; Xie, Xiaohui; Chen, Xiufa; Hou, Deming

2012-08-01

Numerical simulations of volume conduction can be used to analyze the process of energy transfer and explore the effects of some physical factors on energy transfer efficiency. We analyzed the 3D quasi-static electric field by the finite element method, and developed A 3D coupled field-circuit model of volume conduction basing on the coupling between the circuit and the electric field. The model includes a circuit simulation of the volume conduction to provide direct theoretical guidance for energy transfer optimization design. A field-circuit coupling model with circular cylinder electrodes was established on the platform of the software FEM3.5. Based on this, the effects of electrode cross section area, electrode distance and circuit parameters on the performance of volume conduction system were obtained, which provided a basis for optimized design of energy transfer efficiency.

Parallel reduced-instruction-set-computer architecture for real-time symbolic pattern matching

NASA Astrophysics Data System (ADS)

Parson, Dale E.

1991-03-01

This report discusses ongoing work on a parallel reduced-instruction- set-computer (RISC) architecture for automatic production matching. The PRIOPS compiler takes advantage of the memoryless character of automatic processing by translating a program's collection of automatic production tests into an equivalent combinational circuit-a digital circuit without memory, whose outputs are immediate functions of its inputs. The circuit provides a highly parallel, fine-grain model of automatic matching. The compiler then maps the combinational circuit onto RISC hardware. The heart of the processor is an array of comparators capable of testing production conditions in parallel, Each comparator attaches to private memory that contains virtual circuit nodes-records of the current state of nodes and busses in the combinational circuit. All comparator memories hold identical information, allowing simultaneous update for a single changing circuit node and simultaneous retrieval of different circuit nodes by different comparators. Along with the comparator-based logic unit is a sequencer that determines the current combination of production-derived comparisons to try, based on the combined success and failure of previous combinations of comparisons. The memoryless nature of automatic matching allows the compiler to designate invariant memory addresses for virtual circuit nodes, and to generate the most effective sequences of comparison test combinations. The result is maximal utilization of parallel hardware, indicating speed increases and scalability beyond that found for course-grain, multiprocessor approaches to concurrent Rete matching. Future work will consider application of this RISC architecture to the standard (controlled) Rete algorithm, where search through memory dominates portions of matching.