Transformer-rectifier flux pump using inductive current transfer and thermally controlled Nb(3)Sn cryotrons.

PubMed

Atherton, D L; Davies, R

1979-10-01

Transformer-rectifier flux pumps using thermally switched Nb(3)Sn cryotrons are being investigated as a loss make-up device for the proposed isochorically operated (sealed) superconducting magnets for the Canadian Maglev vehicle. High currents (1000 A) were obtained in an experimental flux pump using inductive current transfer and operating at 2 Hz.

SUPERCONDUCTING VANADIUM BASE ALLOY

DOEpatents

Cleary, H.J.

1958-10-21

A new vanadium-base alloy which possesses remarkable superconducting properties is presented. The alloy consists of approximately one atomic percent of palladium, the balance being vanadium. The alloy is stated to be useful in a cryotron in digital computer circuits.

A compact superconducting nanowire memory element operated by nanowire cryotrons

NASA Astrophysics Data System (ADS)

Zhao, Qing-Yuan; Toomey, Emily A.; Butters, Brenden A.; McCaughan, Adam N.; Dane, Andrew E.; Nam, Sae-Woo; Berggren, Karl K.

2018-07-01

A superconducting loop stores persistent current without any ohmic loss, making it an ideal platform for energy efficient memories. Conventional superconducting memories use an architecture based on Josephson junctions (JJs) and have demonstrated access times less than 10 ps and power dissipation as low as 10-19 J. However, their scalability has been slow to develop due to the challenges in reducing the dimensions of JJs and minimizing the area of the superconducting loops. In addition to the memory itself, complex readout circuits require additional JJs and inductors for coupling signals, increasing the overall area. Here, we have demonstrated a superconducting memory based solely on lithographic nanowires. The small dimensions of the nanowire ensure that the device can be fabricated in a dense area in multiple layers, while the high kinetic inductance makes the loop essentially independent of geometric inductance, allowing it to be scaled down without sacrificing performance. The memory is operated by a group of nanowire cryotrons patterned alongside the storage loop, enabling us to reduce the entire memory cell to 3 μm × 7 μm in our proof-of-concept device. In this work we present the operation principles of a superconducting nanowire memory (nMem) and characterize its bit error rate, speed, and power dissipation.

Robust Light Filters Support Powerful Imaging Devices

NASA Technical Reports Server (NTRS)

2009-01-01

Infrared (IR) light filters developed by Lake Shore Cryotronics Inc. of Westerville, Ohio -- using SBIR funding from NASA s Jet Propulsion Laboratory and Langley Research Center -- employ porous silicon and metal mesh technology to provide optical filtration even at the ultra-low temperatures required by many IR sensors. With applications in the astronomy community, Lake Shore s SBIR-developed filters are also promising tools for use in terahertz imaging, the next wave of technology for applications like medical imaging, the study of fragile artworks, and airport security.

A new cryogenic diode thermometer

NASA Astrophysics Data System (ADS)

Courts, S. S.; Swinehart, P. R.; Yeager, C. J.

2002-05-01

While the introduction of yet another cryogenic diode thermometer is not earth shattering, a new diode thermometer, the DT-600 series, recently introduced by Lake Shore Cryotronics, possesses three features that make it unique among commercial diode thermometers. First, these diodes have been probed at the chip level, allowing for the availability of a bare chip thermometer matching a standard curve-an important feature in situations where real estate is at a premium (IR detectors), or where in-situ calibration is difficult. Second, the thermometry industry has assumed that interchangeability should be best at low temperatures. Thus, good interchangeability at room temperatures implies a very good interchangeability at cryogenic temperature, resulting in a premium priced sensor. The DT-600 series diode thermometer is available in an interchangeability band comparable to platinum RTDs with the added advantage of interchangeability to 2 K. Third, and most important, the DT-600 series diode does not exhibit an instability in the I-V characteristic in the 8 K to 20 K temperature range that is observed in other commercial diode thermometer devices [1]. This paper presents performance characteristics for the DT-600 series diode thermometer along with a comparison of I-V curves for this device and other commercial diode thermometers exhibiting an I-V instability.

Effects of room temperature aging on two cryogenic temperature sensor models used in aerospace applications

NASA Astrophysics Data System (ADS)

Courts, S. Scott; Krause, John

2012-06-01

Cryogenic temperature sensors used in aerospace applications are typically procured far in advance of the mission launch date. Depending upon the program, the temperature sensors may be stored at room temperature for extended periods as installation and groundbased testing can take years before the actual flight. The effects of long term storage at room temperature are sometimes approximated by the use of accelerated aging at temperatures well above room temperature, but this practice can yield invalid results as the sensing material and/or electrical contacting method can be increasingly unstable with higher temperature exposure. To date, little data are available on the effects of extended room temperature aging on sensors commonly used in aerospace applications. This research examines two such temperature sensors models - the Lake Shore Cryotronics, Inc. model CernoxTM and DT-670-SD temperature sensors. Sample groups of each model type have been maintained for ten years or longer with room temperature storage between calibrations. Over an eighteen year period, the CernoxTM temperature sensors exhibited a stability of better than ±20 mK for T<30 K and better than ±0.1% of temperature for T>30 K. Over a ten year period the model DT-670-SD sensors exhibited a stability of better than ±140 mK for T<25 K and better than ±75 mK for T>25 K.

Effects of electrostatic discharge on three cryogenic temperature sensor models

NASA Astrophysics Data System (ADS)

Courts, S. Scott; Mott, Thomas B.

2014-01-01

Cryogenic temperature sensors are not usually thought of as electrostatic discharge (ESD) sensitive devices. However, the most common cryogenic thermometers in use today are thermally sensitive diodes or resistors - both electronic devices in their base form. As such, they are sensitive to ESD at some level above which either catastrophic or latent damage can occur. Instituting an ESD program for safe handling and installation of the sensor is costly and it is desirable to balance the risk of ESD damage against this cost. However, this risk cannot be evaluated without specific knowledge of the ESD vulnerability of the devices in question. This work examines three types of cryogenic temperature sensors for ESD sensitivity - silicon diodes, Cernox{trade mark, serif} resistors, and wire wound platinum resistors, all manufactured by Lake Shore Cryotronics, Inc. Testing was performed per TIA/EIA FOTP129 (Human Body Model). Damage was found to occur in the silicon diode sensors at discharge levels of 1,500 V. For Cernox{trade mark, serif} temperature sensors, damage was observed at 3,500 V. The platinum temperature sensors were not damaged by ESD exposure levels of 9,900 V. At the lower damage limit, both the silicon diode and the Cernox{trade mark, serif} temperature sensors showed relatively small calibration shifts of 1 to 3 K at room temperature. The diode sensors were stable with time and thermal cycling, but the long term stability of the Cernox{trade mark, serif} sensors was degraded. Catastrophic failure occurred at higher levels of ESD exposure.

High level gamma radiation effects on Cernox™ cryogenic temperature sensors

NASA Astrophysics Data System (ADS)

Courts, S. S.

2017-12-01

Cryogenic temperature sensors are used in high energy particle colliders to monitor the temperatures of superconducting magnets, superconducting RF cavities, and cryogen infrastructure. While not intentional, these components are irradiated by leakage radiation during operation of the collider. A common type of cryogenic thermometer used in these applications is the Cernox™ resistance thermometer (CxRT) manufactured by Lake Shore Cryotronics, Inc. This work examines the radiation-induced calibration offsets on CxRT models CX-1050-SD-HT and CX-1080-SD-HT resulting from exposure to very high levels of gamma radiation. Samples from two different wafers of each of the two models tested were subjected to a gamma radiation dose ranging from 10 kGy to 5 MGy. Data were analysed in terms of the temperature-equivalent resistance change between pre- and post-irradiation calibrations. The data show that the resistance of these devices decreased following irradiation resulting in positive temperature offsets across the 1.4 K to 330 K temperature range. Variations in response were observed between wafers of the same CxRT model. Overall, the offsets increased with increasing temperature and increasing gamma radiation dose. At 1.8 K, the average offset increased from 0 mK to +13 mK as total dose increased from 10 kGy to 5 MGy. At 4.2 K, the average offset increased from +4 mK to +33 mK as total dose increased from 10 kGy to 5 MGy. Equivalent temperature offset data are presented over the 1.4 K to 330 K temperature range by CxRT model, wafer, and total gamma dose.